Interaction of femtosecond X-ray pulses with periodical multilayer structures

International Nuclear Information System (INIS)

Ksenzov, Dmitry

2010-01-01

The VUV Free Electron Laser FLASH operates in soft X-ray range and produces high-intensive pulse trains with few tens femtoseconds duration. The transversely fully coherent beam will open new experiments in solid state physics which can not be studied with present radiation sources. The study of the time dependent response of the multilayer to the X-ray pulse can provide insights into the process of interaction of highly intense FEL radiation with matter. To test the influence of electron excitation on the optical properties of boron carbide, the refractive index of B 4 C was measured near B K-edge by energy-resolved photon-in-photon-out method probing a Bragg reflection from periodical multilayers. The measured data clearly show that the variation of the fine structure of the Kabsorption edges due to the chemical nature of the absorber element. The knowledge obtained from experiments with continuous radiation was used to design the respective experiments with pulse from the FEL. In my thesis, it is proposed that the geometrical setup, where the incident pulse arrives from the FEL under the angle close to the 1st order ML Bragg peak, provides the most valuable information. Preliminary simulation considering form factors of neutral and ionized boron showed that due to ionization, pronounced changes in the reflectivity curve are expected. The proposed scheme can be the powerful tool to study the various processes within the electronic subsystem of the FEL pulse interaction with matter. This type of investigations gives a deep understanding of the nature of the electronic excitation and the recombination at the femtosecond scale. (orig.)

Interaction of femtosecond X-ray pulses with periodical multilayer structures

Energy Technology Data Exchange (ETDEWEB)

Ksenzov, Dmitry

2010-07-01

The VUV Free Electron Laser FLASH operates in soft X-ray range and produces high-intensive pulse trains with few tens femtoseconds duration. The transversely fully coherent beam will open new experiments in solid state physics which can not be studied with present radiation sources. The study of the time dependent response of the multilayer to the X-ray pulse can provide insights into the process of interaction of highly intense FEL radiation with matter. To test the influence of electron excitation on the optical properties of boron carbide, the refractive index of B{sub 4}C was measured near B K-edge by energy-resolved photon-in-photon-out method probing a Bragg reflection from periodical multilayers. The measured data clearly show that the variation of the fine structure of the Kabsorption edges due to the chemical nature of the absorber element. The knowledge obtained from experiments with continuous radiation was used to design the respective experiments with pulse from the FEL. In my thesis, it is proposed that the geometrical setup, where the incident pulse arrives from the FEL under the angle close to the 1st order ML Bragg peak, provides the most valuable information. Preliminary simulation considering form factors of neutral and ionized boron showed that due to ionization, pronounced changes in the reflectivity curve are expected. The proposed scheme can be the powerful tool to study the various processes within the electronic subsystem of the FEL pulse interaction with matter. This type of investigations gives a deep understanding of the nature of the electronic excitation and the recombination at the femtosecond scale. (orig.)

Status and limitations of multilayer X-ray interference structures

International Nuclear Information System (INIS)

Kortright, J.B.

1996-01-01

Trends in the performance of x-ray multilayer interference structures with periods ranging from 9 to 130 (angstrom) are reviewed. Analysis of near-normal incidence reflectance data vs photon energy reveals that the effective interface with σ in a static Debye-Waller model, describing interdiffusion and roughness, decreases as the multilayer period decreases, and reaches a lower limit of roughly 2 (angstrom). Specular reflectance and diffuse scattering from uncoated and multilayer-coated substrates having different roughness suggest that this lower limit results largely from substrate roughness. The increase in interface width with period thus results from increasing roughness of interdiffusion as the layer thickness increases

Characterization of X-UV multilayers by grazing incidence X-ray reflectometry

International Nuclear Information System (INIS)

Nevot, L.; Pardo, B.; Corno, J.

1988-01-01

The performance of multilayers at the X-UV wavelengths depends upon the structural and geometrical imperfections of the deposited materials. These two respective contributions are not easily separated when only one Bragg peak is recorded, as is usually the case in the X-UV range, so a prediction of the performance at other wavelengths appears rather doubtful. We show how grazing incidence X-ray reflectometry (using Cu Kα 1 radiation) allows the precise evaluation of both interfacial roughnesses and thickness errors, as well as their variations through the stacks. As examples, we analyse three (W/C) multilayers with periods between 3 to 6 nm and up to 40 layers

Deposition and characterization of multilayers on thin foil x-ray mirrors for high-throughput x-ray telescopes

DEFF Research Database (Denmark)

Hussain, Ahsen M.; Joensen, Karsten D.; Hoeghoej, P.

1996-01-01

W/Si and Co/C multilayers have been deposited on epoxy- replicated Au mirrors from the ASTRO-E telescope project, SPectrum Roentgen Gamma (SRG) flight mirrors, DURAN glass substrates and Si witness wafers. A characterization of the multilayers with both hard x-rays and soft x-rays is presented....... This clearly indicates the effectiveness of the epoxy-replication process for the production of smooth substrates for multilayer deposition to be used in future x-ray telescopes....

Multilayer X-ray imaging systems

Science.gov (United States)

Shealy, D. L.; Hoover, R. B.; Gabardi, D. R.

1986-01-01

An assessment of the imaging properties of multilayer X-ray imaging systems with spherical surfaces has been made. A ray trace analysis was performed to investigate the effects of using spherical substrates (rather than the conventional paraboloidal/hyperboloidal contours) for doubly reflecting Cassegrain telescopes. These investigations were carried out for mirrors designed to operate at selected soft X-ray/XUV wavelengths that are of significance for studies of the solar corona/transition region from the Stanford/MSFC Rocket X-Ray Telescope. The effects of changes in separation of the primary and secondary elements were also investigated. These theoretical results are presented as well as the results of ray trace studies to establish the resolution and vignetting effects as a function of field angle and system parameters.

X-ray diffraction of multilayers and superlattices

International Nuclear Information System (INIS)

Bartels, W.J.; Hornstra, J.; Lobeek, D.J.W.

1986-01-01

Recursion formulae for calculating the reflected amplitude ratio of multilayers and superlattices have been derived from the Takagi-Taupin differential equations, which describe the dynamical diffraction of X-rays in deformed crystals. Calculated rocking curves of complicated layered structures, such as non-ideal superlattices on perfect crystals, are shown to be in good agreement with observed diffraction profiles. The kinematical theory can save computing time only in the case of an ideal superlattice, for which a geometric series can be used, but the reflections must be below 10% so that multiple reflections can be neglected. For a perfect crystal of arbitrary thickness the absorption at the center of the dynamical reflection is found to be proportional to the square root of the reflectivity. Sputter-deposited periodic multilayers of tungsten and carbon can be considered as an artificial crystal, for which dynamical X-ray diffraction calculations give results very similar to those of a macroscopic optical description in terms of the complex index of refraction and Fresnel reflection coefficients. (orig.)

Bonded Multilayer Laue Lens for focusing hard X-rays

International Nuclear Information System (INIS)

Liu Chian; Conley, R.; Qian, J.; Kewish, C.M.; Macrander, A.T.; Maser, J.; Kang, H.C.; Yan, H.; Stephenson, G.B.

2007-01-01

We have fabricated partial Multilayer Laue Lens (MLL) linear zone plate structures with thousands of alternating WSi 2 and Si layers and various outermost zone widths according to the Fresnel zone plate formula. Using partial MLL structures, we were able to focus hard X-rays to line foci with a width of 30 nm and below. Here, we describe challenges and approaches used to bond these multilayers to achieve line and point focusing. Bonding was done by coating two multilayers with AuSn and heating in a vacuum oven at 280-300 o C. X-ray reflectivity measurements confirmed that there was no change in the multilayers after heating to 350 o C. A bonded MLL was polished to a 5-25 μm wedge without cracking. SEM image analyses found well-positioned multilayers after bonding. These results demonstrate the feasibility of a bonded full MLL for focusing hard X-rays

W/SiC X-ray multilayers optimized for use above 100 keV

DEFF Research Database (Denmark)

Windt, D.L.; Dongey, S.; Hailey, C.J.

2002-01-01

-derived optical constants, which we determined from reflectance-vs-incidence angle measurements also made using synchrotron radiation, in the range E=120 - 180 keV. We describe our experimental investigation in detail, compare the new W/SiC multilayers with both W/Si and W/B4C films that have been studied......We have developed a new depth-graded multilayer system comprising W and SiC layers, suitable for use as hard X-ray reflective coatings operating in the energy range 100 - 200 keV. Grazing incidence X-ray reflectance at E=8 keV was used to characterize the interface widths, as well as the temporal...... and thermal stability in both periodic and depth-graded W/SiC structures, while synchrotron radiation was used to measure the hard X-ray reflectance of a depth-graded multilayer designed specifically for use in the range Esimilar to150 - 170 keV. We have modeled the hard X-ray reflectance using newly...

W/SiC x-ray multilayers optimized for use above 100 keV

DEFF Research Database (Denmark)

Windt, D.L.; Donguy, S.; Hailey, C.J.

2003-01-01

optical constants, which we determined from reflectance versus incidence angle measurements also made using synchrotron radiation, in the range E = 120-180 keV. We describe our experimental investigation in detail, compare the new W/SiC multilayers with both W/Si and W/B4C films that have been studied......We have developed a new depth-graded multilayer system comprising W and SiC layers, suitable for use as hard x-ray reflective coatings operating in the energy range 100-200 keV. Grazing-incidence x-ray reflectance at E = 8 keV was used to characterize the interface widths, as well as the temporal...... and thermal stability in both periodic and depth-graded W/SiC structures, whereas synchrotron radiation was used to measure the hard x-ray reflectance of a depth-graded multilayer designed specifically for use in, the range Esimilar to150-170 keV. We have modeled the hard x-ray reflectance using newly derived...

Electromagnetic fields of Nanometer electromagnetic waves and X-ray. New frontiers of electromagnetic wave engineering

International Nuclear Information System (INIS)

2009-01-01

The investigating committee aimed at research on electromagnetic fields in functional devices and X-ray fibers for efficient coherent X-ray generation and their material science, high-precision manufacturing, X-ray microscope, application to medical and information communication technologies, such as interaction between material and nanometer electromagnetic waves of radiated light and X-ray, interaction between microwaves and particle beams, theory and design of high-frequency waveguides for resonator and accelerator, from January 2003 to December 2005. In this report, we describe our research results, in particular, on the topics of synchrotron radiation and Cherenkov radiation, Kyushu synchrotron light source and its technology, nanometer electromagnetic fields in optical region, process of interaction between evanescent waves and near-field light, orthogonal relation of electromagnetic fields including evanescent waves in dispersive dielectrics, optical amplification using electron beam, nanometer electromagnetic fields in focusing waveguide lens device with curved facets, electromagnetic fields in nanometer photonic crystal waveguide consisting of atoms, X-ray scattering and absorption I bio-material for image diagnosis. (author)

An X-ray grazing incidence phase multilayer grating

CERN Document Server

Chernov, V A; Mytnichenko, S V

2001-01-01

An X-ray grazing incidence phase multilayer grating, representing a thin grating placed on a multilayer mirror, is proposed. A high efficiency of grating diffraction can be obtained by the possibility of changing the phase shift of the wave diffracted from the multilayer under the Bragg and total external reflection conditions. A grazing incidence phase multilayer grating consisting of Pt grating stripes on a Ni/C multilayer and optimized for the hard X-ray range was fabricated. Its diffraction properties were studied at photon energies of 7 and 8 keV. The obtained maximum value of the diffraction efficiency of the +1 grating order was 9% at 7 keV and 6.5% at 8 keV. The data obtained are in a rather good accordance with the theory.

An experimental measurement of metal multilayer x-ray reflectivity degradation due to intense x-ray flux

International Nuclear Information System (INIS)

Hockaday, M.Y.P.

1987-06-01

The degradation of the x-ray reflection characteristics of metal multilayer Bragg diffractors due to intense x-ray flux was investigated. The Z-pinch plasma produced by PROTO II of Sandia National Laboratories, Albuquerque, New Mexico, was used as the source. The plasma generated total x-ray yields of as much as 40 kJ with up to 15 kJ in the neon hydrogen- and helium-like resonance lines in nominal 20-ns pulses. Molybdenum-carbon, palladium-carbon, and tungsten-carbon metal multilayers were placed at 15 and 150 cm from the plasma center. The multilayers were at nominal angles of 5 0 and 10 0 to diffract the neon resonance lines. The time-integrated x-ray reflection of the metal multilayers was monitored by x-ray film. A fluorescer-fiber optic-visible streak camera detector system was then used to monitor the time-resolved x-ray reflection characteristics of 135 A- 2d tungsten-carbon multilayers. A large specular component in the reflectivity prevented determination of the rocking curve of the multilayer. For a neon implosion onto a vanadium-doped polyacrylic acid foam target shot, detailed modeling was attempted. The spectral flux was determined with data from 5 XRD channels and deconvolved using the code SHAZAM. The observed decay in reflectivity was assumed to correspond to the melting of the first tungsten layer. A ''conduction factor'' of 82 was required to manipulate the heat loading of the first tungsten layer such that the time of melting corresponded to the observed decay. The power at destruction was 141 MW/cm 2 and the integrated energy at destruction was 2.0 J/cm 2 . 82 refs., 66 figs., 10 tabs

High reflectance Cr/C multilayer at 250 eV for soft X-ray polarimetry

Energy Technology Data Exchange (ETDEWEB)

Wen, Mingwu; Jiang, Li; Zhang, Zhong; Huang, Qiushi [MOE Key Laboratory of Advanced Micro-Structured Materials, Institute of Precision Optical Engineering (IPOE), School of Physics Science and Engineering, Tongji University, Shanghai 200092 (China); Wang, Zhanshan, E-mail: wangzs@tongji.edu.cn [MOE Key Laboratory of Advanced Micro-Structured Materials, Institute of Precision Optical Engineering (IPOE), School of Physics Science and Engineering, Tongji University, Shanghai 200092 (China); She, Rui; Feng, Hua [Department of Engineering Physics, Tsinghua University, Beijing (China); Wang, Hongchang [Diamond Light Source, Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE (United Kingdom)

2015-10-01

X-ray reflection near 45° via multilayer mirrors can be used for astronomical polarization measurements. A Cr/C multilayer mirror (designed for X-ray polarimetry at 250 eV), with a period thickness of 3.86 nm and a bi-layer number of 100, was fabricated using direct current magnetron sputtering. Grazing incidence X-ray reflectometry at 8 keV and transmission electron microscopy were used to investigate the multilayer structure. Different models were introduced to fit the hard X-ray reflectivity curve, which indicates that the layer thickness of two materials slightly drifts from the bottom to the top of the stack. Both the chromium and carbon layers are amorphous with asymmetric interfaces, while the Cr-on-C interface is slightly wider. Based on the good quality of the multilayer structure, a high reflectivity of 21.8% for the s-polarized light was obtained at 250 eV at a grazing incidence angle of 40.7°. The fabricated Cr/C multilayer mirror exhibits high reflectivity and polarization levels in the energy region of 240 eV–260 eV. - Highlights: • We fabricated Cr/C multilayer with 3.8 nm d-spacing. • X-ray reflectometry was used to determine the exact structure of Cr/C multilayer. • A high reflectivity of 21.8% for the s-polarized light was obtained at 250 eV. • Both Cr and C were found to be amorphous with slightly asymmetric interfaces. • A 4-layer model was used to fit and explain the results.

Ultra-short period X-ray mirrors: Production and investigation

International Nuclear Information System (INIS)

Bibishkin, M.S.; Chkhalo, N.I.; Fraerman, A.A.; Pestov, A.E.; Prokhorov, K.A.; Salashchenko, N.N.; Vainer, Yu.A.

2005-01-01

Technological problems that deal with manufacturing of highly effective ultra-short (d=0.7-3.2 nm) period X-ray multilayer mirrors (MLM) are discussed in the article. In an example of Cr/Sc and W/B 4 C MLM it is experimentally shown, that the problem of periodicity and selectivity for multilayer dispersive X-ray elements has been generally solved by now. However, the problem of short-period MLM reflectivity increase related to existing of transitive borders between layers in structures remains rather urgent. The new technique of tungsten deposition using the RF source in order to decrease roughness in borders is discussed and tested. The results of measurements on wavelengths of 0.154, 0.834 and 1.759 nm are given. The RbAP crystals ordinary used in experiments and short-period W/B 4 C MLM produced are compared. The specular and non-specular characteristics of scattering on the 0.154 nm wavelengths are also measured in order to study transitive borders structures

"{Deposition and characterization of multilayers on thin foil x-ray

DEFF Research Database (Denmark)

Hussain, A.M.; Joensen, K.D.; Hoeghoej, P.

1996-01-01

W/Si and Co/C multilayers have been deposited on epoxy- replicated Au mirrors from the ASTRO-E telescope project, SPectrum Roentgen Gamma (SRG) flight mirrors, DURAN glass substrates and Si witness wafers. A characterization of the multilayers with both hard x-rays and soft x-rays is presented. T...

High-energy x-ray microscopy with multilayer reflectors (invited)

International Nuclear Information System (INIS)

Underwood, J.H.

1986-01-01

A knowledge of the spatial distribution of the x rays emitted by the hot plasma region is a key element in the study of the physical processes occurring in laser-produced plasmas and complements other diagnostics such as spectroscopy and temporal studies. X-ray microscopy with reflection microscopes offers the most direct means of obtaining this information. Until recently, the two types of microscopes that had been developed for this purpose, the Kirkpatrick--Baez and the Wolter, operated at relatively low energies (about 4--5 keV) and had very little spectral selectivity, relying on filters for coarse spectral resolution. With the development of x-ray reflecting multilayer mirrors, the energy response of such microscopes can be extended to 10 keV or higher, with good spectral selectivity. In addition, it is possible to reduce some of the optical aberrations to obtain improved spatial resolution. This paper describes some of the recent progress in making and evaluating x-ray reflectors, and outlines the optical design considerations for multilayer-coated microscopes. Results from a prototype multilayer K--B microscope are presented

High-resolution X-ray diffraction studies of multilayers

DEFF Research Database (Denmark)

Christensen, Finn Erland; Hornstrup, Allan; Schnopper, H. W.

1988-01-01

High-resolution X-ray diffraction studies of the perfection of state-of-the-art multilayers are presented. Data were obtained using a triple-axis perfect-crystal X-ray diffractometer. Measurements reveal large-scale figure errors in the substrate. A high-resolution triple-axis set up is required...

Spectral tailoring of nanoscale EUV and soft x-ray multilayer optics

Science.gov (United States)

Huang, Qiushi; Medvedev, Viacheslav; van de Kruijs, Robbert; Yakshin, Andrey; Louis, Eric; Bijkerk, Fred

2017-03-01

Extreme ultraviolet and soft X-ray (XUV) multilayer optics have experienced significant development over the past few years, particularly on controlling the spectral characteristics of light for advanced applications like EUV photolithography, space observation, and accelerator- or lab-based XUV experiments. Both planar and three dimensional multilayer structures have been developed to tailor the spectral response in a wide wavelength range. For the planar multilayer optics, different layered schemes are explored. Stacks of periodic multilayers and capping layers are demonstrated to achieve multi-channel reflection or suppression of the reflective properties. Aperiodic multilayer structures enable broadband reflection both in angles and wavelengths, with the possibility of polarization control. The broad wavelength band multilayer is also used to shape attosecond pulses for the study of ultrafast phenomena. Narrowband multilayer monochromators are delivered to bridge the resolution gap between crystals and regular multilayers. High spectral purity multilayers with innovated anti-reflection structures are shown to select spectrally clean XUV radiation from broadband X-ray sources, especially the plasma sources for EUV lithography. Significant progress is also made in the three dimensional multilayer optics, i.e., combining micro- and nanostructures with multilayers, in order to provide new freedom to tune the spectral response. Several kinds of multilayer gratings, including multilayer coated gratings, sliced multilayer gratings, and lamellar multilayer gratings are being pursued for high resolution and high efficiency XUV spectrometers/monochromators, with their advantages and disadvantages, respectively. Multilayer diffraction optics are also developed for spectral purity enhancement. New structures like gratings, zone plates, and pyramids that obtain full suppression of the unwanted radiation and high XUV reflectance are reviewed. Based on the present achievement

X-ray diffuse scattering effects from Coulomb-type defects in multilayered structures

International Nuclear Information System (INIS)

Olikhovskii, S.I.; Molodkin, V.B.; Skakunova, E.S.; Kislovskii, E.N.; Fodchuk, I.M.

2009-01-01

The theoretical X-ray diffraction model starting from Takagi-Taupin equation has been developed for the description of coherent and diffuse components of the rocking curve (RC) measured from the multilayered crystal structure with randomly distributed Coulomb-type defects in all the layers and substrate. The model describes both diffuse scattering (DS) intensity distribution and influence of DS on attenuation and angular redistribution of the coherent X-ray scattering intensity. By analyzing the total measured RC with using the proposed diffraction model, the chemical compositions, strains, and characteristics of dislocation loops in layers and substrate of the multilayered structure with InGaAsN/GaAs single quantum well have been determined. (Abstract Copyright [2009], Wiley Periodicals, Inc.)

Exploring interface morphology of a deeply buried layer in periodic multilayer

Energy Technology Data Exchange (ETDEWEB)

Das, Gangadhar; Srivastava, A. K.; Tiwari, M. K., E-mail: mktiwari@rrcat.gov.in [Indus Synchrotrons Utilization Division, Raja Ramanna Centre for Advanced Technology, Indore-452013, Madhya Pradesh (India); Homi Bhabha National Institute, Anushaktinagar, Mumbai-400094, Maharashtra (India); Khooha, Ajay; Singh, A. K. [Indus Synchrotrons Utilization Division, Raja Ramanna Centre for Advanced Technology, Indore-452013, Madhya Pradesh (India)

2016-06-27

Long-term durability of a thin film device is strongly correlated with the nature of interface structure associated between different constituent layers. Synthetic periodic multilayer structures are primarily employed as artificial X-ray Bragg reflectors in many applications, and their reflection efficiency is predominantly dictated by the nature of the buried interfaces between the different layers. Herein, we demonstrate the applicability of the combined analysis approach of the X-ray reflectivity and grazing incidence X-ray fluorescence measurements for the reliable and precise determination of a buried interface structure inside periodic X-ray multilayer structures. X-ray standing wave field (XSW) generated under Bragg reflection condition is used to probe the different constituent layers of the W- B{sub 4}C multilayer structure at 10 keV and 12 keV incident X-ray energies. Our results show that the XSW assisted fluorescence measurements are markedly sensitive to the location and interface morphology of a buried layer structure inside a periodic multilayer structure. The cross sectional transmission electron microscopy results obtained on the W-B{sub 4}C multilayer structure provide a deeper look on the overall reliability and accuracy of the XSW method. The method described here would also be applicable for nondestructive characterization of a wide range of thin film based semiconductor and optical devices.

X-ray scattering from periodic arrays of quantum dots

International Nuclear Information System (INIS)

Holy, V; Stangl, J; Lechner, R T; Springholz, G

2008-01-01

Three-dimensional periodic arrays of self-organized quantum dots in semiconductor multilayers are investigated by high-resolution x-ray scattering. We demonstrate that the statistical parameters of the dot array can be determined directly from the scattering data without performing a numerical simulation of the scattered intensity.

A Magnetron Sputter Deposition System for the Development of X-Ray Multilayer Optics

Science.gov (United States)

Broadway, David

2015-01-01

The project objective is to establish the capability to deposit multilayer structures for x-ray, neutron, and extreme ultraviolet (EUV) optic applications through the development of a magnetron sputtering deposition system. A specific goal of this endeavor is to combine multilayer deposition technology with the replication process in order to enhance NASA Marshall Space Flight Center's (MSFC's) position as a world leader in the design of innovative x-ray instrumentation through the development of full shell replicated multilayer optics. The development of multilayer structures are absolutely necessary in order to advance the field of x-ray astronomy by pushing the limit for observing the universe to ever-increasing photon energies (i.e., up to 200 keV or higher), well beyond Chandra's (approx.10 keV) and NuStar's (approx.75 keV) capability. The addition of multilayer technology would significantly enhance the x-ray optics capability at MSFC and allow NASA to maintain its world leadership position in the development, fabrication, and design of innovative x-ray instrumentation, which would be the first of its kind by combining multilayer technology with the mirror replication process. This marriage of these technologies would allow astronomers to see the universe in a new light by pushing to higher energies that are out of reach with today's instruments. To this aim, a magnetron vacuum sputter deposition system for the deposition of novel multilayer thin film x-ray optics is proposed. A significant secondary use of the vacuum deposition system includes the capability to fabricate multilayers for applications in the field of EUV optics for solar physics, neutron optics, and x-ray optics for a broad range of applications including medical imaging.

A Magnetron Sputter Deposition System for the Development of Multilayer X-Ray Optics

Science.gov (United States)

Broadway, David; Ramsey, Brian; Gubarev, Mikhail

2014-01-01

The proposal objective is to establish the capability to deposit multilayer structures for x-ray, neutron, and EUV optic applications through the development of a magnetron sputtering deposition system. A specific goal of this endeavor is to combine multilayer deposition technology with the replication process in order to enhance the MSFC's position as a world leader in the design of innovative X-ray instrumentation through the development of full shell replicated multilayer optics. The development of multilayer structures is absolutely necessary in order to advance the field of X-ray astronomy by pushing the limit for observing the universe to ever increasing photon energies (i. e. up to 200 keV or higher); well beyond Chandra (approx. 10 keV) and NuStar's (approx. 75 keV) capability. The addition of multilayer technology would significantly enhance the X-ray optics capability at MSFC and allow NASA to maintain its world leadership position in the development, fabrication and design of innovative X-ray instrumentation which would be the first of its kind by combining multilayer technology with the mirror replication process. This marriage of these technologies would allow astronomers to see the universe in a new light by pushing to higher energies that are out of reach with today's instruments.To this aim, a magnetron vacum sputter deposition system for the deposition of novel multilayer thin film X-ray optics is proposed. A significant secondary use of the vacuum deposition system includes the capability to fabricate multilayers for applications in the field of EUV optics for solar physics, neutron optics, and X-ray optics for a broad range of applications including medical imaging.

Design of grazing-incidence multilayer supermirrors for hard-X-ray reflectors

DEFF Research Database (Denmark)

Joensen, K. D.; Voutov, P.; Szentgyorgyi, A.

1995-01-01

Extremely broadband grazing-incidence multilayers for hard-X-ray reflection can be obtained by a gradual change of the layer thicknesses down through the structure. Existing approaches for designing similar neutron optics, called supermirrors, are shown to provide respectable performance when...... applied to X-ray multilayers. However, none of these approaches consider the effects of imperfect layer interfaces and absorption in the overlying layers. Adaptations of neutron designs that take these effects into account are presented, and a thorough analysis of two specific applications (a single hard......-X-ray reflector and a hard-X-ray telescope) shows that an improved performance can be obtained. A multilayer whose bilayer thicknesses are given by a power law expression is found to provide the best solution; however, it is only slightly better than some of the adapted neutron designs...

Soft-X-Ray Projection Lithography Using a High-Repetition-Rate Laser-Induced X-Ray Source for Sub-100 Nanometer Lithography Processes

NARCIS (Netherlands)

E. Louis,; F. Bijkerk,; Shmaenok, L.; Voorma, H. J.; van der Wiel, M. J.; Schlatmann, R.; Verhoeven, J.; van der Drift, E. W. J. M.; Romijn, J.; Rousseeuw, B. A. C.; Voss, F.; Desor, R.; Nikolaus, B.

1993-01-01

In this paper we present the status of a joint development programme on soft x-ray projection lithography (SXPL) integrating work on high brightness laser plasma sources. fabrication of multilayer x-ray mirrors. and patterning of reflection masks. We are in the process of optimization of a

An imitative calculation of W/C, Mo/Si articifial multilayered films' structures and properties as X-ray monochromators

International Nuclear Information System (INIS)

Liu Wen; Liu Wenhan; Wu Ziqin

1989-01-01

An imitative calculation on W/C and Mo/Si artificial multilayered films have been made. The influences of total period numbers and deviation of period thickness on X-ray diffraction peak were given. Two difference diviations, random fluctuation and system linear deviation have been imitated, their influences on X-ray energy distinguish power have been compared

A hard X-ray telescope/concentrator design based on graded period multilayer coatings

DEFF Research Database (Denmark)

Christensen, Finn Erland; Joensen, K. D.; Gorenstein, P.

1995-01-01

It is shown that compact designs of multifocus, conical approximations to highly nested Wolter I telescopes, as well as single reflection concentrators, employing realistic graded period W/Si or Ni/C multilayer coatings, allow one to obtain more than 1000 cm2 of on-axis effective area at 40 ke...... that it is smaller than roughly 1 mm. The design can be realized with foils as thin (≤0.4 mm) as used for ASCA and SODART or with closed, slightly thicker (∼1.0 mm) mirror shells as used for JET-X and XMM. The effect of an increase of the inner radius is quantified on the effective area for multilayered mirrors up...

Soft-x-ray fluorescence study of buried silicides in antiferromagnetically coupled Fe/Si multilayers

Energy Technology Data Exchange (ETDEWEB)

Carlisle, J.A.; Chaiken, A.; Michel, R.P. [Lawrence Berkeley National Lab., CA (United States)] [and others

1997-04-01

Multilayer films made by alternate deposition of two materials play an important role in electronic and optical devices such as quantum-well lasers and x-ray mirrors. In addition, novel phenomena like giant magnetoresistance and dimensional crossover in superconductors have emerged from studies of multilayers. While sophisticated x-ray techniques are widely used to study the morphology of multilayer films, progress in studying the electronic structure has been slower. The short mean-free path of low-energy electrons severely limits the usefulness of photoemission and related electron free path of low-energy electrons severely limit spectroscopies for multilayer studies. Soft x-ray fluorescence (SXF) is a bulk-sensitive photon-in, photon-out method to study valence band electronic states. Near-edge x-ray absorption fine-structure spectroscopy (NEXAFS) measured with partial photon yield can give complementary bulk-sensitive information about unoccupied states. Both these methods are element-specific since the incident x-ray photons excite electrons from core levels. By combining NEXAFS and SXF measurements on buried layers in multilayers and comparing these spectra to data on appropriate reference compounds, it is possible to obtain a detailed picture of the electronic structure. Results are presented for a study of a Fe/Si multilayer system.

Soft-x-ray fluorescence study of buried silicides in antiferromagnetically coupled Fe/Si multilayers

International Nuclear Information System (INIS)

Carlisle, J.A.; Chaiken, A.; Michel, R.P.

1997-01-01

Multilayer films made by alternate deposition of two materials play an important role in electronic and optical devices such as quantum-well lasers and x-ray mirrors. In addition, novel phenomena like giant magnetoresistance and dimensional crossover in superconductors have emerged from studies of multilayers. While sophisticated x-ray techniques are widely used to study the morphology of multilayer films, progress in studying the electronic structure has been slower. The short mean-free path of low-energy electrons severely limits the usefulness of photoemission and related electron free path of low-energy electrons severely limit spectroscopies for multilayer studies. Soft x-ray fluorescence (SXF) is a bulk-sensitive photon-in, photon-out method to study valence band electronic states. Near-edge x-ray absorption fine-structure spectroscopy (NEXAFS) measured with partial photon yield can give complementary bulk-sensitive information about unoccupied states. Both these methods are element-specific since the incident x-ray photons excite electrons from core levels. By combining NEXAFS and SXF measurements on buried layers in multilayers and comparing these spectra to data on appropriate reference compounds, it is possible to obtain a detailed picture of the electronic structure. Results are presented for a study of a Fe/Si multilayer system

Optical properties of boron carbide near the boron K edge evaluated by soft-x-ray reflectometry from a Ru/B4C multilayer

Energy Technology Data Exchange (ETDEWEB)

Ksenzov, Dmitriy; Panzner, Tobias; Schlemper, Christoph; Morawe, Christian; Pietsch, Ullrich

2009-12-10

Soft-x-ray Bragg reflection from two Ru/B4C multilayers with 10 and 63 periods was used for independent determination of both real and imaginary parts of the refractive index n = 1 -{delta} + i{beta} close to the boron K edge ({approx}188 eV). Prior to soft x-ray measurements, the structural parameters of the multilayers were determined by x-ray reflectometry using hard x rays. For the 63-period sample, the optical properties based on the predictions made for elemental boron major deviations were found close to the K edge of boron for the 10-period sample explained by chemical bonding of boron to B4C and various boron oxides.

X-ray radiation effects in multilayer epitaxial graphene

Energy Technology Data Exchange (ETDEWEB)

Hicks, Jeremy; Tinkey, Holly; Hankinson, John; Heer, Walt A. de; Conrad, Edward H. [School of Physics, Georgia Institute of Technology, Atlanta, Georgia 30332 (United States); Arora, Rajan; Kenyon, Eleazar; Chakraborty, Partha S.; Cressler, John D. [School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332 (United States); Berger, Claire [School of Physics, Georgia Institute of Technology, Atlanta, Georgia 30332 (United States); CNRS-Institut Neel, BP 166, 38042 Grenoble Cedex 9 (France)

2011-12-05

We characterize multilayer graphene grown on C-face SiC before and after exposure to a total ionizing dose of 12 Mrad(SiO{sub 2}) using a 10 keV x-ray source. While we observe the partial peeling of the top graphene layers and the appearance of a modest Raman D-peak, we find that the electrical characteristics (mobility, sheet resistivity, free carrier concentration) of the material are mostly unaffected by radiation exposure. Combined with x-ray photoelectron spectroscopy data showing numerous carbon-oxygen bonds after irradiation, we conclude that the primary damage mechanism is through surface etching from reactive oxygen species created by the x-rays.

Measured reflectance of graded multilayer mirrors designed for astronomical hard X-ray telescopes

DEFF Research Database (Denmark)

Christensen, Finn Erland; Craig, W.W.; Windt, D.L.

2000-01-01

Future astronomical X-ray telescopes, including the balloon-borne High-Energy Focusing Telescope (HEFT) and the Constellation-X Hard X-ray Telescope (Con-X HXT) plan to incorporate depth-graded multilayer coatings in order to extend sensitivity into the hard X-ray (10 less than or similar to E less......-graded W/Si multilayers optimized for broadband performance up to 69.5 keV (WK-edge). These designs are ideal for both the HEFT and Con-X HXT applications. We compare the measurements to model calculations to demonstrate that the reflectivity can be well described by the intended power law distribution...

X-ray electromagnetic application technology

International Nuclear Information System (INIS)

2011-01-01

The investigating committee aimed at research on electromagnetic fields in functional devices and X-ray fibers for efficient coherent X-ray generation and their material science, high-precision manufacturing, particularly for X-ray electromagnetic application technology from January 2006 to December 2008. In this report, we describe our research results, in particular, on the topics of synchrotron radiation and free-electron laser, Saga Synchrotron Project, X-ray waveguides and waveguide-based lens-less hard-X-ray imaging, X-ray nanofocusing for capillaries and zone plates, dispersion characteristics in photonics crystal consisting of periodic atoms for nanometer waveguides, electromagnetic characteristics of grid structures for scattering fields of nano-meter electromagnetic waves and X-rays, FDTD parallel computing of fundamental scattering and attenuation characteristics of X-ray for medical imaging diagnosis, orthogonal relations of electromagnetic fields including evanescent field in dispersive medium. (author)

Effect of FEL induced ionization on X-ray reflectivity of multilayers

Energy Technology Data Exchange (ETDEWEB)

Ksenzov, Dmitriy; Grigorian, Souren; Pietsch, Ullrich [University of Siegen (Germany)

2009-07-01

The VUV-FEL in Hamburg (FLASH) emits short-pulse radiation with wavelengths from 6 to 30 nm and a pulse length of 10-50 fs. The FLASH wavelength allows x-ray diffraction experiments at periodical multilayer's structures acting as 1D crystal. The probe of depth selective interaction of the high-intense x-ray short pulse with these objects can be used to obtain information about possible electronic excitation and various recombination processes inside multilayers. As known from recent experiments at FLASH, the later ones are most likely using highly intense FEL radiation. The ML reflectivity is analyzed for case of that the optical parameters are changing as function of the depth of the penetrating incident pulse into the multilayer. The response is studied for the model system La/B{sub 4}C using two experimental conditions both at fixed incidence angle: 1) the energy of the incident pulses, E, coincides with the energy of the 1st order multilayer Bragg peak, E{sub B}, of the reflection curve, and 2) the energy of incident pulse differs by a small dE from E{sub B}. The ML response to a given sub-pulse differs for both conditions. However, there is a clear fingerprint of ionization for both conditions for the case that E is close to the K-absorption edge of B-atoms. Our results support respective efforts to measure the optical parameters of solids under high-intense FEL radiation.

Preliminary investigation of changes in x-ray multilayer optics subjected to high radiation flux

International Nuclear Information System (INIS)

Hockaday, M.P.; Blake, R.L.; Grosso, J.S.; Selph, M.M.; Klein, M.M.; Matuska, W. Jr.; Palmer, M.A.; Liefeld, R.J.

1985-01-01

A variety of metal multilayers was exposed to high x-ray flux using Sandia National Laboratories' PROTO II machine in the gas puff mode. Fluxes incident on the multilayers above 700 MW/cm 2 in total radiation, in nominal 20 ns pulses, were realized. The neon hydrogen- and helium-like resonance lines were used to probe the x-ray reflectivity properties of the multilayers as they underwent change of state during the heating pulse. A fluorescer-fiber optic-streak camera system was used to monitor the changes in x-ray reflectivity as a function of time and irradiance. Preliminary results are presented for a W/C multilayer. Work in progress to model the experiment is discussed. 13 refs., 4 figs

A refined model for characterizing x-ray multilayers

International Nuclear Information System (INIS)

Oren, A.L.; Henke, B.L.

1987-12-01

The ability to quickly and accurately characterize arbitrary multilayers is very valuable for not only can we use the characterizations to predict the reflectivity of a multilayer for any soft x-ray wavelength, we also can generalize the results to apply to other multilayers of the same type. In addition, we can use the characterizations as a means of evaluating various sputtering environments and refining sputtering techniques to obtain better multilayers. In this report we have obtained improved characterizations for sample molybdenum-silicon and vanadium-silicon multilayers. However, we only examined five crystals overall, so the conclusions that we could draw about the structure of general multilayers is limited. Research involving many multilayers manufactured under the same sputtering conditions is clearly in order. In order to best understand multilayer structures it may be necessary to further refine our model, e.g., adopting a Gaussian form for the interface regions. With such improvements we can expect even better agreement with experimental values and continued concurrence with other characterization techniques. 18 refs., 30 figs., 7 tabs

X-ray scattering from thin organic films and multilayer

International Nuclear Information System (INIS)

Pietsch, U.; Barberka, T. A.; Geue, Th.; Stoemmer, R.

1997-01-01

The real structure of LB-multilayers prepared with fatty-acid salts is dominated by finite-sized scattering aggregates. Their different length scales become visible using AFM. It shows that not the whole substrate is wetted by the film. The molecular order is restricted into domains. These micrometer domains are not homogeneous. They contain mesoscopic subdomains of different heights which vary in steps of double layers. Finally high-resolution AFM-maps display a nearly hexagonal arrangement of molecules within subgrains with a diameter of several 10 nm. This domain structure has to be taken into account when interpreting X-ray diffraction data. The size of the crystalline aggregates is obtained by means of X-ray grazing incidence diffraction. On the mesoscopic scale the domain size is determined by X-ray diffuse scattering experiments. Because Sinha's model fails for the present kind of multilayers, they used another approach for data analysis. The lateral correlation length caused by height fluctuations is estimated without knowledge of a definite correlation function. Additionally the mosaicity of the domain orientation can be taken into account

Experimental studies and modeling of X-Rays multilayer mirrors damages under high X-Ray flux generated by a laser-plasma experiment; Etude experimentale et modelisation de l`endommagement des miroirs multicouches X soumis a de hauts flux de rayonnement X dans le cadre de l`experience plasma-laser

Energy Technology Data Exchange (ETDEWEB)

Le Guern, F

1996-05-24

We have been able with this work to point out characterize X-Rays multilayers mirrors damages. We have designed two experimental set-up which have been installed in the HELIOTROPE experimental chamber of the OCTAL facility located at the CEA in Limeil-Valenton. We have demonstrated that X-Rays multilayer mirrors properties were drastically modified by X-Rays emitted by a golden laser plasma. We have, more precisely, introduced the damage speed concept to quantify the expansion of the multilayer mirror period. We have been able to classify different multilayer mirrors in function of their resistance to damage and we have demonstrated that a silicate layer deposited on a mirror allowed to increase his resistance to damage. In a second part we have developed a simulation tool in order to simulate the X-Rays multilayer mirrors optical properties modifications. We have therefore coupled a thermo-mechanic code with an optical program. The results of the simulations are in a rather good agreement with the experiments and can be used to predict, before experiments, the multilayer mirror behavior under X-Rays irradiation. (author) 55 refs.

The optical properties of boron carbide near boron K-edge inside periodical multilayers

Energy Technology Data Exchange (ETDEWEB)

Ksenzov, Dmitriy; Schlemper, Christoph; Pietsch, Ullrich [University of Siegen (Germany)

2010-07-01

Multilayer mirrors made for the use in the wavelength range near K-edge of boron (188 eV) are of great interest for X-ray fluorescence analysis of boron content in doped semiconductors, plasma diagnostics, astronomy and lithography. Moreover, multilayer mirrors composed by a metal and a low Z element like boron are used as optical elements in both the soft x-ray spectral range as well as at higher photon energies on 3rd generation synchrotron beamlines. Using an energy-resolved photon-in-photon-out method we reconstructed the optical data from energy dependence of both integrated peak intensity and FWHM of the 1st order ML Bragg peak measured at the UHV triple axis soft-x-ray reflectometer at BESSY II. The experiments clearly demonstrate that the peak shape of the ML Bragg peak is most sensitive to any kind of electronic excitation and recombination in solid. The soft-ray reflectivity can give detailed information for MLs with thickness up to several tens of nanometers. In addition, measurements close to a resonance edge probe the chemical state of the respective constituent accompanied with a high sensitivity of changes close to the sample surface.

Study of Cr/Sc-based multilayer reflecting mirrors using soft x-ray reflectivity and standing wave-enhanced x-ray fluorescence

Science.gov (United States)

Wu, Meiyi; Burcklen, Catherine; André, Jean-Michel; Guen, Karine Le; Giglia, Angelo; Koshmak, Konstantin; Nannarone, Stefano; Bridou, Françoise; Meltchakov, Evgueni; Rossi, Sébastien de; Delmotte, Franck; Jonnard, Philippe

2017-11-01

We study Cr/Sc-based multilayer mirrors designed to work in the water window range using hard and soft x-ray reflectivity as well as x-ray fluorescence enhanced by standing waves. Samples differ by the elemental composition of the stack, the thickness of each layer, and the order of deposition. This paper mainly consists of two parts. In the first part, the optical performances of different Cr/Sc-based multilayers are reported, and in the second part, we extend further the characterization of the structural parameters of the multilayers, which can be extracted by comparing the experimental data with simulations. The methodology is detailed in the case of Cr/B4C/Sc sample for which a three-layer model is used. Structural parameters determined by fitting reflectivity curve are then introduced as fixed parameters to plot the x-ray standing wave curve, to compare with the experiment, and confirm the determined structure of the stack.

Large-area soft x-ray projection lithography using multilayer mirrors structured by RIE

Science.gov (United States)

Rahn, Steffen; Kloidt, Andreas; Kleineberg, Ulf; Schmiedeskamp, Bernt; Kadel, Klaus; Schomburg, Werner K.; Hormes, F. J.; Heinzmann, Ulrich

1993-01-01

SXPL (soft X-ray projection lithography) is one of the most promising applications of X-ray reflecting optics using multilayer mirrors. Within our collaboration, such multilayer mirrors were fabricated, characterized, laterally structured and then used as reflection masks in a projecting lithography procedure. Mo/Si-multilayer mirrors were produced by electron beam evaporation in UHV under thermal treatment with an in-situ X-ray controlled thickness in the region of 2d equals 14 nm. The reflectivities measured at normal incidence reached up to 54%. Various surface analysis techniques have been applied in order to characterize and optimize the X-ray mirrors. The multilayers were patterned by reactive ion etching (RIE) with CF(subscript 4), using a photoresist as the etch mask, thus producing X-ray reflection masks. The masks were tested in the synchrotron radiation laboratory of the electron accelerator ELSA at the Physikalisches Institut of Bonn University. A double crystal X-ray monochromator was modified so as to allow about 0.5 cm(superscript 2) of the reflection mask to be illuminated by white synchrotron radiation. The reflected patterns were projected (with an energy of 100 eV) onto the resist (Hoechst AZ PF 514), which was mounted at an average distance of about 7 mm. In the first test-experiments, structure sizes down to 8 micrometers were nicely reproduced over the whole of the exposed area. Smaller structures were distorted by Fresnel-diffraction. The theoretically calculated diffraction images agree very well with the observed images.

X-ray scattering in giant magneto-resistive multilayers

International Nuclear Information System (INIS)

Fulthorpe, B.D.

1999-01-01

The scattering mechanisms responsible for Giant Magneto-Resistance (GMR) in magnetic multilayers are believed to be related to many aspects of the multilayer structure. X-ray scattering techniques provide a powerful method with which to study the bulk and interface morphology in these systems, and are therefore crucial in developing an understanding of the dominant factors influencing the magnitude of the GMR. Reflectivity measurements performed on a series of Co/Cu multilayers, sputter deposited onto etched silicon, reveal no variation in the interface roughness with etching voltage, the thickness of the individual layers also remaining constant. The observed decrease in the GMR cannot, therefore, be attributed to variations in spacer thickness or interfacial spin-independent scattering. Electron and X-ray Diffraction measurements suggest the reduction in GMR is due to a loss of antiferromagnetic coupling associated with a transformation of the texture from a randomly oriented to well oriented (111) polycrystalline texture, and subsequent reduction in the volume fraction of (100) oriented grains. Interfaces within Co/Cu are found to propagate with a high degree of conformality with increasing bilayer number, with an out-of-plane correlation length well in excess of 300A. In contrast, the Co/Pt system exhibits a limiting out-of-plane correlation length of the order of 350A arising from a columnar growth mode. X-ray Reflectivity and Diffraction measurements provide' no structural interpretation for the 3-fold enhancement in the rate of increase of the saturation conductivity, as a function of spacer thickness, in Fe/Au (100) compared to Fe/Au (111), or why large oscillations in the GMR occur for the (100) orientation only. Such observations are, however, consistent with the existence of a channelling mechanism in Fe/Au (100). Grazing Incidence Fluorescence data indicates that Nb acts as a surfactant in Fe/Au (111) growth on sapphire. The influence of different

Resonant diffuse X-ray scattering from magnetic multilayers

International Nuclear Information System (INIS)

Spezzani, Carlo; Torelli, Piero; Delaunay, Renaud; Hague, C.F.; Petroff, Frederic; Scholl, Andreas; Gullikson, E.M.; Sacchi, Maurizio

2004-01-01

We have measured field-dependent resonant diffuse scattering from a magnetoresistive Co/Cu multilayer. We have observed that the magnetic domain size in zero field depends on the magnetic history of the sample. The results of the X-ray scattering analysis have been compared to PEEM images of the magnetic domains

Cr/B{sub 4}C multilayer mirrors: Study of interfaces and X-ray reflectance

Energy Technology Data Exchange (ETDEWEB)

Burcklen, C.; Meltchakov, E.; Jérome, A.; Rossi, S. de; Delmotte, F. [Laboratoire Charles Fabry, Institut d' Optique Graduate School, CNRS, Université Paris-Saclay, 91127 Palaiseau Cedex (France); Soufli, R. [Laboratoire Charles Fabry, Institut d' Optique Graduate School, CNRS, Université Paris-Saclay, 91127 Palaiseau Cedex (France); Lawrence Livermore National Laboratory, 7000 East Avenue, Livermore, California 94550 (United States); Dennetiere, D.; Polack, F.; Capitanio, B.; Thomasset, M. [Synchrotron SOLEIL, L' Orme des Merisiers, Saint Aubin, BP 48F-91192 Gif sur Yvette Cedex (France); Gullikson, E. [Center for X-ray Optics, Lawrence Berkeley National Laboratory, 1 Cyclotron Rd., Berkeley, California 94720 (United States)

2016-03-28

We present an experimental study of the effect of layer interfaces on the x-ray reflectance in Cr/B{sub 4}C multilayer interference coatings with layer thicknesses ranging from 0.7 nm to 5.4 nm. The multilayers were deposited by magnetron sputtering and by ion beam sputtering. Grazing incidence x-ray reflectometry, soft x-ray reflectometry, and transmission electron microscopy reveal asymmetric multilayer structures with a larger B{sub 4}C-on-Cr interface, which we modeled with a 1–1.5 nm thick interfacial layer. Reflectance measurements in the vicinity of the Cr L{sub 2,3} absorption edge demonstrate fine structure that is not predicted by simulations using the currently tabulated refractive index (optical constants) values for Cr.

X-ray propagation through a quasi-ordered multilayered structure ...

African Journals Online (AJOL)

We investigate the propagation of short wavelength transverse electric x-rays through a quasiordered (Fibonacci) atomically commensurate multilayered structure using a transfer matrix model which treats each atomic plane as a diffraction unit. The reflectance spectrum has a rich structure being dominated by peaks ...

Optimization of graded multilayer designs for astronomical x-ray telescopes

DEFF Research Database (Denmark)

Mao, P.H.; Harrison, F.A.; Windt, D.L.

1999-01-01

We developed a systematic method for optimizing the design of depth-graded multilayers for astronomical hard-x-ray and soft-gamma-ray telescopes based on the instrument's bandpass and the field of view. We apply these methods to the design of the conical-approximation Wolter I optics employed...... by the balloon-borne High Energy Focusing Telescope, using W/Si as the multilayer materials. In addition, we present optimized performance calculations of mirrors, using other material pairs that are capable of extending performance to photon energies above the W K-absorption edge (69.5 keV), including Pt/C, Ni...

An approach to the theory of X-ray multilayers with graded period

CERN Document Server

Vinogradov, A V

2000-01-01

A wide bandpass for multilayer mirrors can be obtained by gradually changing their period. In this paper the theory of such optical elements is developed on the basis of the general theory of wave propagation through layered medium. The results of reflectivity calculation for broadband mirrors are presented. The suggested theory is a natural step to the inverse problem - design of multilayers with the required wavelength dependence of reflectivity.

Interpretation of interfacial structures in X-ray multilayers by TEM Fresnel fringe effects

OpenAIRE

Nguyen, Tai D.; O'Keefe, Michael A.; Kilaas, Roar; Gronsky, Ronald; Kortright, Jeffrey B.

1991-01-01

Assessment of interfacial structures from high-resolution TEM images of cross-sectional specimens is difficult due to Fresnel fringe effects producing different apparent structures in the images. The effects of these fringes have been commonly over-looked in efforts of making quantitative interpretation of interfacial profiles. In this report, we present the observations of the Fresnel fringes in nanometer period Mo/Si, W/C, and WC/C multilayers in through-focus-series TEM images. Calculation...

Transition radiation in metal-metal multilayer nanostructures as a medical source of hard x-ray radiation

International Nuclear Information System (INIS)

Pokrovsky, A. L.; Kaplan, A. E.; Shkolnikov, P. L.

2006-01-01

We show that a periodic metal-metal multilayer nanostructure can serve as an efficient source of hard x-ray transition radiation. Our research effort is aimed at developing an x-ray source for medical applications, which is based on using low-energy relativistic electrons. The approach toward choosing radiator-spacer couples for the generation of hard x-ray resonant transition radiation by few-MeV electrons traversing solid multilayer structures for the energies of interest to medicine (30-50 keV) changes dramatically compared with that for soft x-ray radiation. We show that one of the main factors in achieving the required resonant line is the absence of the contrast of the refractive indices between the spacer and the radiator at the far wings of the radiation line; for that purpose, the optimal spacer, as a rule, should have a higher atomic number than the radiator. Having experimental goals in mind, we have considered also the unwanted effects due to bremsstrahlung radiation, absorption and scattering of radiated photons, detector-related issues, and inhibited coherence of transition radiation due to random deviation of spacing between the layers. Choosing as a model example a Mo-Ag radiator-spacer pair of materials, we demonstrate that the x-ray transition radiation line can be well resolved with the use of spatial and frequency filtering

A Soft X-ray Spectrometer using a Highly Dispersive Multilayer Grating

International Nuclear Information System (INIS)

Warwick, Tony; Padmore, Howard; Voronov, Dmitriy; Yashchuk, Valeriy

2010-01-01

There is a need for higher resolution spectrometers as a tool for inelastic x-ray scattering. Currently, resolving power around R = 10,000 is advertised. Measured RIXS spectra are often limited by this instrumental resolution and higher resolution spectrometers using conventional gratings would be prohibitively large. We are engaged in a development program to build blazed multilayer grating structures for diffracting soft x-rays in high order. This leads to spectrometers with dispersion much higher than is possible using metal coated-gratings. The higher dispersion then provides higher resolution and the multilayer gratings are capable of operating away from grazing incidence as required. A spectrometer design is presented with a total length 3.8 m and capable of 10 5 resolving power.

A Soft X-ray Spectrometer using a Highly Dispersive Multilayer Grating

International Nuclear Information System (INIS)

Warwick, Tony; Padmore, Howard; Voronov, Dmitriy; Yashchuk, Valeriy

2010-01-01

There is a need for higher resolution spectrometers as a tool for inelastic x-ray scattering. Currently, resolving power around R = 10,000 is advertised. Measured RIXS spectra are often limited by this instrumental resolution and higher resolution spectrometers using conventional gratings would be prohibitively large. We are engaged in a development program to build blazed multilayer grating structures for diffracting soft x-rays in high order. This leads to spectrometers with dispersion much higher than is possible using metal coated-gratings. The higher dispersion then provides higher resolution and the multilayer gratings are capable of operating away from grazing incidence as required. A spectrometer design is presented with a total length 3.8m and capable of 10 5 resolving power.

X-ray refractive index: A tool to determine the average composition in multilayer structures

International Nuclear Information System (INIS)

Miceli, P.F.; Neumann, D.A.; Zabel, H.

1986-01-01

We present a novel and simple method to determine the average composition of multilayers and superlattices by measuring the x-ray refractive index. Since these modulated structures exhibit Bragg reflections at small angles, by using a triple axis x-ray spectrometer we have accurately determined the peak shifts due to refraction in GaAs/Al/sub x/Ga/sub 1-x/As and Nb/Ta superlattices. Knowledge of the refractive index provides the average fractional composition of the periodic structure since the refractive index is a superposition of the refractive indices of the atomic constituents. We also present a critical discussion of the method and compare the values of the average fractional composition obtained in this manner to the values obtained from the lattice parameter change in the GaAs/Al/sub x/Ga/sub 1-x/As superlattices due to the Al

A compressed sensing X-ray camera with a multilayer architecture

Science.gov (United States)

Wang, Zhehui; Iaroshenko, O.; Li, S.; Liu, T.; Parab, N.; Chen, W. W.; Chu, P.; Kenyon, G. T.; Lipton, R.; Sun, K.-X.

2018-01-01

Recent advances in compressed sensing theory and algorithms offer new possibilities for high-speed X-ray camera design. In many CMOS cameras, each pixel has an independent on-board circuit that includes an amplifier, noise rejection, signal shaper, an analog-to-digital converter (ADC), and optional in-pixel storage. When X-ray images are sparse, i.e., when one of the following cases is true: (a.) The number of pixels with true X-ray hits is much smaller than the total number of pixels; (b.) The X-ray information is redundant; or (c.) Some prior knowledge about the X-ray images exists, sparse sampling may be allowed. Here we first illustrate the feasibility of random on-board pixel sampling (ROPS) using an existing set of X-ray images, followed by a discussion about signal to noise as a function of pixel size. Next, we describe a possible circuit architecture to achieve random pixel access and in-pixel storage. The combination of a multilayer architecture, sparse on-chip sampling, and computational image techniques, is expected to facilitate the development and applications of high-speed X-ray camera technology.

The reflected amplitude ratio of multilayers and superlattice describe the dynamical diffraction of x-rays

International Nuclear Information System (INIS)

Bhatti, Q.A.; Mangi, F.A.

2006-01-01

Calculating the rocking curves of complicated layered structures, such as non-ideal super lattices on perfect crystals are clearly exposed with observed diffraction profile. Recursion formulas for calculating reflected amplitude ratio of multilayer and super lattices have been involved from the Takagi-Taupin differential equation, which describes the dynamical diffraction of X-rays in deformed crystal. The Kinematical theory can computing time only in case of ideal superlattice for which geometric series can be used but the reflectivity must be below 10 % so that multiple reflections can be neglected for a perfect crystal of arbitrary thickness the absorption at the centre of the dynamical reflection is found to be proportional to the square root of the reflectivity. Sputter- deposited periodic multilayers of tungsten and carbon can be considered as an artificial crystal, for which dynamical X-rays diffraction calculations give the result very similar to those of macroscopic optical description in terms of the complex index of refraction and Frensnel relation coefficient. (author)

High quality multilayer mirrors for soft X-rays

Energy Technology Data Exchange (ETDEWEB)

Grimmer, H.; Boeni, P.; Breitmeier, U.; Clemens, D.; Horisberger, M. [Paul Scherrer Inst. (PSI), Villigen (Switzerland); Mertins, H.C.; Schaefers, F. [BESSY, Berlin (Germany)

1997-09-01

In an effort to develop optical components for X-rays with wavelengths in the water window (2.3 -4.4 nm) multilayer structures have been designed for the following applications: in transmission as phase shifters to change linear into circular polarization, in reflection as mirrors close to normal incidence and as linear polarizers at an angle of incidence of 45{sup o}. (author) 1 fig., 1 tab., 1 ref.

Dispersive x-ray synchrotron studies of Pt-C multilayers

International Nuclear Information System (INIS)

Smither, R.K.; Rodricks, B.; Lamelas, F.; Medjahed, D.; Dos Passos, W.; Clarke, R.; Ziegler, E.; Fontaine, A.

1989-02-01

We demonstrate the simultaneous acquisition of high-resolution x-ray absorption spectra and scattering data, using a combination of energy-dispersive optics and a two-dimensional CCD detector. Results are presented on the optical constants of Pt and on the reflectivity of a platinum-carbon multilayer at the L/sub III/ absorption edge of Pt. 12 refs., 5 figs

X-ray Multilayers and Thin-Shell Substrate Surface-Figure Correction

Science.gov (United States)

Windt, David

We propose a comprehensive experimental research program whose two main goals are (a) to improve the performance of hard X-ray multilayer coatings and (b) to develop a high-throughput method to correct mid-frequency surface errors in thin-shell mirror substrates. Achieving these goals will enable the cost-effective construction of light- weight, highly-nested X-ray telescopes having greater observational sensitivity, wider energy coverage, and higher angular resolution than can be achieved at present. The realization of this technology will thus benefit the development of a variety of Explorer- class NASA X-ray astronomy missions now being formulated for both the soft and hard X-ray bands, and will enable the construction of future facility-class X-ray missions that will require both high sensitivity and high resolution. Building on the success of our previous APRA-funded research, we plan to investigate new thin-film growth techniques, new materials, and new aperiodic coating designs in order to develop new hard X-ray multilayers that have higher X-ray reflectance, wider energy response, lower film stress, and good stability, and that can be produced more quickly, at reduced cost. Additionally, we propose to build upon our extensive experience in sub-nm film-thickness control using velocity modulation and masked deposition techniques, and in the recent development of low-roughness, low-stress films grown by reactive sputtering, in order to develop new methods for correcting mid-frequency surface errors in thin-shell mirror substrates using both differential deposition and ion-beam figuring, either alone or in combination. These two surface-correction techniques already being used for sub-nm figuring of precision optics in a variety of disciplines, including diffraction-limited EUV lithography and synchrotron applications requiring sub-micron focusing are ideally suited for controlling mm-scale surface errors in the thin-shell substrates used for astronomical X-ray

Multilayer coating facility for the HEFT hard x-ray telescope

DEFF Research Database (Denmark)

Cooper-Jensen, Carsten P.; Christensen, Finn Erland; Chen, Hubert

2001-01-01

A planar magnetron sputtering facility has been established at the Danish Space Research Institute (DSRI) for the production coating of depth graded multilayers on the thermally slumped glass segments which form the basis for the hard X-ray telescope on the HEFT balloon project. The facility...

Soft X-ray imaging of thick carbon-based materials using the normal incidence multilayer optics.

Science.gov (United States)

Artyukov, I A; Feschenko, R M; Vinogradov, A V; Bugayev, Ye A; Devizenko, O Y; Kondratenko, V V; Kasyanov, Yu S; Hatano, T; Yamamoto, M; Saveliev, S V

2010-10-01

The high transparency of carbon-containing materials in the spectral region of "carbon window" (lambda approximately 4.5-5nm) introduces new opportunities for various soft X-ray microscopy applications. The development of efficient multilayer coated X-ray optics operating at the wavelengths of about 4.5nm has stimulated a series of our imaging experiments to study thick biological and synthetic objects. Our experimental set-up consisted of a laser plasma X-ray source generated with the 2nd harmonics of Nd-glass laser, scandium-based thin-film filters, Co/C multilayer mirror and X-ray film UF-4. All soft X-ray images were produced with a single nanosecond exposure and demonstrated appropriate absorption contrast and detector-limited spatial resolution. A special attention was paid to the 3D imaging of thick low-density foam materials to be used in design of laser fusion targets.

Spectral tailoring of nanoscale EUV and soft x-ray multilayer optics

NARCIS (Netherlands)

Huang, Qiushi; Medvedev, Viacheslav; van de Kruijs, Robbert Wilhelmus Elisabeth; Yakshin, Andrey; Louis, Eric; Bijkerk, Frederik

2017-01-01

Extreme ultraviolet and soft X-ray (XUV) multilayer optics have experienced significant development over the past few years, particularly on controlling the spectral characteristics of light for advanced applications like EUV photolithography, space observation, and accelerator- or lab-based XUV

Optomechanical Design of a Hard X-ray Nanoprobe Instrument with Nanometer-Scale Active Vibration Control

International Nuclear Information System (INIS)

Shu, D.; Preissner, C.; Smolyanitskiy, A.; Maser, J.; Winarski, R.; Holt, M.; Lai, B.; Vogt, S.; Stephenson, G. B.

2007-01-01

We are developing a new hard x-ray nanoprobe instrument that is one of the centerpieces of the characterization facilities of the Center for Nanoscale Materials being constructed at Argonne National Laboratory. This new probe will cover an energy range of 3-30 keV with 30-nm spacial resolution. The system is designed to accommodate x-ray optics with a resolution limit of 10 nm, therefore, it requires staging of x-ray optics and specimens with a mechanical repeatability of better than 5 nm. Fast feedback for differential vibration control between the zone-plate x-ray optics and the sample holder has been implemented in the design using a digital-signal-processor-based real-time closed-loop feedback technique. A specially designed, custom-built laser Doppler displacement meter system provides two-dimensional differential displacement measurements with subnanometer resolution between the zone-plate x-ray optics and the sample holder. The optomechanical design of the instrument positioning stage system with nanometer-scale active vibration control is presented in this paper

In situ x-ray reflectivity and grazing incidence x-ray diffraction study of L 1{sub 0} ordering in {sup 57}Fe/Pt multilayers

Energy Technology Data Exchange (ETDEWEB)

Raghavendra Reddy, V; Gupta, Ajay; Gome, Anil [UGC-DAE Consortium for Scientific Research, University Campus, Khandwa Road, Indore-452 017 (India); Leitenberger, Wolfram [Institute of Physics, University of Potsdam, 14469 Potsdam (Germany); Pietsch, U [Physics Department, University of Siegen, D-57068 Siegen (Germany)], E-mail: vrreddy@csr.ernet.in, E-mail: varimalla@yahoo.com

2009-05-06

In situ high temperature x-ray reflectivity and grazing incidence x-ray diffraction measurements in the energy dispersive mode are used to study the ordered face-centered tetragonal (fct) L 1{sub 0} phase formation in [Fe(19 A)/Pt(25 A)]{sub x 10} multilayers prepared by ion beam sputtering. With the in situ x-ray measurements it is observed that (i) the multilayer structure first transforms to a disordered FePt and subsequently to an ordered fct L 1{sub 0} phase, (ii) the ordered fct L 1{sub 0} FePt peaks start to appear at 320 deg. C annealing, (iii) the activation energy of the interdiffusion is 0.8 eV and (iv) ordered fct FePt grains have preferential out-of-plane texture. The magneto-optical Kerr effect and conversion electron Moessbauer spectroscopies are used to study the magnetic properties of the as-deposited and 400 deg. C annealed multilayers. The magnetic data for the 400 {sup 0}C annealed sample indicate that the magnetization is at an angle of {approx}50 deg. from the plane of the film.

Design and development of the multilayer optics for the new hard x-ray mission

Science.gov (United States)

Pareschi, G.; Basso, S.; Citterio, O.; Spiga, D.; Tagliaferri, G.; Civitani, M.; Raimondi, L.; Sironi, G.; Cotroneo, V.; Negri, B.; Parodi, Giancarlo; Martelli, F.; Borghi, G.; Orlandi, A.; Vernani, D.; Valsecchi, G.; Binda, R.; Romaine, S.; Gorenstein, P.; Attinà, P.

2017-11-01

The New Hard X-ray Mission (NHXM) project will be operated by 2017 and is currently undergoing a Phase B study, under the coordination of the Italian Space Agency (ASI). The project is being proposed by an international team in the context of the ESA Call CV M3 as a Small Mission program, with a large Italian participation. It is based on 4 hard X-ray optics modules, each formed by 60 evenly spaced multilayer coated Wolter I mirror shells. An extensible bench is used to reach the 10 m focal length. The Wolter I monolithic substrates with multilayer coating are produced in NiCo by electroforming replication. Three of the mirror modules will host in the focal plane a hybrid a detector system (a soft X-ray Si DEPFET array plus a high energy CdTe detector). The detector of the fourth telescope will be a photoelectric polarimeter with imaging capabilities, operating from 2 up to 35 keV. The total on axis effective area of the three telescopes at 1 keV and 30 kev is of 1500 cm2 and 350 cm2 respectively, with an angular resolution of 20 arcsec HEW at 30 keV. In this paper we report on the design and development of the multilayer coated X-ray mirrors based on NiCo shells.

Analytic theory of soft x-ray diffraction by lamellar multilayer gratings

NARCIS (Netherlands)

Kozhevnikov, I.V.; van der Meer, R.; Bastiaens, Hubertus M.J.; Boller, Klaus J.; Bijkerk, Frederik

2011-01-01

An analytic theory describing soft x-ray diffraction by Lamellar Multilayer Gratings (LMG) has been developed. The theory is derived from a coupled waves approach for LMGs operating in the single-order regime, where an incident plane wave can only excite a single diffraction order. The results from

Simultaneous parameter optimization of x-ray and neutron reflectivity data using genetic algorithms

International Nuclear Information System (INIS)

Singh, Surendra; Basu, Saibal

2016-01-01

X-ray and neutron reflectivity are two non destructive techniques which provide a wealth of information on thickness, structure and interracial properties in nanometer length scale. Combination of X-ray and neutron reflectivity is well suited for obtaining physical parameters of nanostructured thin films and superlattices. Neutrons provide a different contrast between the elements than X-rays and are also sensitive to the magnetization depth profile in thin films and superlattices. The real space information is extracted by fitting a model for the structure of the thin film sample in reflectometry experiments. We have applied a Genetic Algorithms technique to extract depth dependent structure and magnetic in thin film and multilayer systems by simultaneously fitting X-ray and neutron reflectivity data.

Simultaneous parameter optimization of x-ray and neutron reflectivity data using genetic algorithms

Science.gov (United States)

Singh, Surendra; Basu, Saibal

2016-05-01

X-ray and neutron reflectivity are two non destructive techniques which provide a wealth of information on thickness, structure and interracial properties in nanometer length scale. Combination of X-ray and neutron reflectivity is well suited for obtaining physical parameters of nanostructured thin films and superlattices. Neutrons provide a different contrast between the elements than X-rays and are also sensitive to the magnetization depth profile in thin films and superlattices. The real space information is extracted by fitting a model for the structure of the thin film sample in reflectometry experiments. We have applied a Genetic Algorithms technique to extract depth dependent structure and magnetic in thin film and multilayer systems by simultaneously fitting X-ray and neutron reflectivity data.

Simultaneous parameter optimization of x-ray and neutron reflectivity data using genetic algorithms

Energy Technology Data Exchange (ETDEWEB)

Singh, Surendra, E-mail: surendra@barc.gov.in; Basu, Saibal [Solid State Physics Division, Bhabha Atomic Research Centre, Mumbai 400085 India (India)

2016-05-23

X-ray and neutron reflectivity are two non destructive techniques which provide a wealth of information on thickness, structure and interracial properties in nanometer length scale. Combination of X-ray and neutron reflectivity is well suited for obtaining physical parameters of nanostructured thin films and superlattices. Neutrons provide a different contrast between the elements than X-rays and are also sensitive to the magnetization depth profile in thin films and superlattices. The real space information is extracted by fitting a model for the structure of the thin film sample in reflectometry experiments. We have applied a Genetic Algorithms technique to extract depth dependent structure and magnetic in thin film and multilayer systems by simultaneously fitting X-ray and neutron reflectivity data.

Neutron, x-ray scattering and TEM studies of Ni-Ti multilayers

International Nuclear Information System (INIS)

Keem, J.E.; Wood, J.; Grupido, N.; Hart, K.; Nutt, S.; Reichel, D.G.; Yelon, W.B.

1988-01-01

The authors present an analysis of Ni-Ti multilayer neutron reflectors and supermirrors undertaken to identify the causes of the lower than expected observed scattering power and critical angle enhancement of Ni-Ti supermirrors. Results of these investigations focus attention on cusp formation in the Ni-Ti bilayers as probable cause for the reduced neutron scattering power. Grazing angle x-ray and neutron scattering, wide angle neutron diffraction and analytical cross sectional TEM have been used. The multilayers were produced by magnetron sputtering and ion-beam deposition on float glass substrates and silicon wafers

A Magnetron Sputter Deposition System for the Development of Multilayer X-Ray Optics

Data.gov (United States)

National Aeronautics and Space Administration — The proposal objective is to establish the capability to deposit multilayer structures for X-ray, neutron, and EUV optic applications through the development of a...

Optomechanical design of a hard x-ray nanoprobe instrument with active vibration control in nanometer scale

International Nuclear Information System (INIS)

Shu, D.; Maser, J.; Holt, M.; Winarski, R.; Preissner, C.; Smolyanitskiy, A.; Lai, B.; Vogt, S.; Stephenson, G.

2007-01-01

We are developing a new hard x-ray nanoprobe instrument that is one of the centerpieces of the characterization facilities of the Center for Nanoscale Materials being constructed at Argonne National Laboratory. This new probe will cover an energy range of 3-30 keV with 30-nm spatial resolution. The system is designed to accommodate x-ray optics with a resolution limit of 10 nm, therefore, it requires staging of x-ray optics and specimens with a mechanical repeatability of better than 5 nm. Fast feedback for differential vibration control between the zone-plate x-ray optics and the sample holder has been implemented in the design using a digital-signal-processor-based real-time closed-loop feedback technique. A specially designed, custom-built laser Doppler displacement meter system provides two-dimensional differential displacement measurements with subnanometer resolution between the zone-plate x-ray optics and the sample holder. The optomechanical design of the instrument positioning stage system with nanometer-scale active vibration control is presented in this paper.

A study of the reactivity of elemental Cr/Se/Te thin multilayers using X-ray reflectometry, in situ X-ray diffraction and X-ray absorption spectroscopy

International Nuclear Information System (INIS)

Behrens, Malte; Tomforde, Jan; May, Enno; Kiebach, Ragnar; Bensch, Wolfgang; Haeussler, Dietrich; Jaeger, Wolfgang

2006-01-01

The reactivity of [Cr/Se/Te] multilayers under annealing was investigated using X-ray reflectometry, in situ X-ray diffraction, X-ray absorption fine structure (XAFS) measurements and transmission electron microscopy. For all samples, interdiffusion was complete at temperatures between 100 and 300 deg. C, depending on the repeating tri-layer thickness. A crystalline phase nucleated approximately 20 deg. C above the temperature where interdiffusion was finished. The first crystalline phase in a binary Cr/Te sample was layered CrTe 3 nucleating at 230 deg. C. In ternary samples (Se:Te=0.6-1.2), the low-temperature nucleation of such a layered CrQ 3 (Q=Se, Te) phase is suppressed and instead the phase Cr 2 Q 3 nucleates first. Interestingly, this phase decomposes around 500 deg. C into layered CrQ 3 . In contrast, binary Cr/Se samples form stable amorphous alloys after interdiffusion and Cr 3 Se 4 nucleates around 500 deg. C as the only crystalline phase. Evaluation of the XAFS data of annealed samples yield Se-Cr distances of 2.568(1) and 2.552(1) A for Cr 2 Q 3 and CrQ 3 , respectively. In the latter sample, higher coordination shells around Se are seen accounting for the Se-Te contacts in the structure. - Graphical abstract: The first step of the reaction of elemental Cr/Te/Se-multilayers is the interdiffusion of the elements as evidenced by the decay of the modulation peaks in the low-angle region of the X-ray diffraction patterns. The subsequent growth of Bragg peaks at higher scattering angles indicates crystallization of chromium chalcogenide Cr 2 Te 3- x Se x

Upgrading multilayer zone plate technology for hard x-ray focusing

Energy Technology Data Exchange (ETDEWEB)

Hirotomo, Toshiki; Konishi, Shigeki [Graduate School of Material Science, University of Hyogo, Kamigori, Hyogo 678-1297 (Japan); SPring-8 Service Co., Ltd (Japan); Takano, Hidekazu, E-mail: htakano@sci.u-hyogo.ac.jp; Sumida, Kazuhiro; Tsusaka, Yoshiyuki; Kagoshima, Yasushi [Graduate School of Material Science, University of Hyogo, Kamigori, Hyogo 678-1297 (Japan); Koyama, Takahisa [Graduate School of Material Science, University of Hyogo, Kamigori, Hyogo 678-1297 (Japan); Japan Synchrotron Radiation Research Institute (JASRI/SPring-8) (Japan); Ichimaru, Satoshi; Ohchi, Tadayuki [NTT Advanced Technology Corporation (Japan); Takenaka, Hisataka [NTT Advanced Technology Corporation (Japan); TOYAMA Corporation (Japan)

2016-01-28

Multilayer zone plate (MZP) technology for hard X-ray focusing was upgraded and its focusing performance was evaluated using 20-keV X-rays at the synchrotron beamline (BL24XU) of SPring-8. The MZP consists of MoSi{sub 2} and Si layers alternately deposited on a glass fiber by magnetron sputtering so that all zone boundaries satisfy the Fresnel zone configuration. The focused beam was evaluated using knife-edge scanning in which the measured intensity distribution is identical to the line spread function (LSF) in the focal plane. The focused beamsize of about 30 nm was estimated by oscillation peaks observed in the measured LSF according to Rayleigh’s criterion.

Characterization of ion-beam mixed multilayers via grazing x-ray reflectometry

International Nuclear Information System (INIS)

Le Boite, M.G.; Traverse, A.; Nevot, L.; Pardo, B.; Corno, J.

1988-01-01

The grazing x-ray reflectrometry technique was used as a way to study modifications in metallic multilayers induced by ion-beam irradiation. Due to the high sensitivity of the technique, short-range atomic displacements of an atom A in a layer B can be detected so that the first stages of ion-beam mixing can be investigated. The rate of mixing is measured and the compound A/sub 1-//sub x/B/sub x/ formed at the layers' interfaces is characterized

High efficiency multilayer blazed gratings for EUV and soft X-rays: Recent developments

International Nuclear Information System (INIS)

Voronov, Dmitriy; Ahn, Minseung; Anderson, Erik; Cambie, Rossana; Chang, Chih-Hao; Goray, Leonid; Gullikson, Eric; Heilmann, Ralf; Salmassi, Farhad; Schattenburg, Mark; Warwick, Tony; Yashchuk, Valeriy; Padmore, Howard

2011-01-01

Multilayer coated blazed gratings with high groove density are the best candidates for use in high resolution EUV and soft x-ray spectroscopy. Theoretical analysis shows that such a grating can be potentially optimized for high dispersion and spectral resolution in a desired high diffraction order without significant loss of diffraction efficiency. In order to realize this potential, the grating fabrication process should provide a perfect triangular groove profile and an extremely smooth surface of the blazed facets. Here we report on recent progress achieved at the Advanced Light Source (ALS) in fabrication of high quality multilayer coated blazed gratings. The blazed gratings were fabricated using scanning beam interference lithography followed by wet anisotropic etching of silicon. A 200 nm period grating coated with a Mo/Si multilayer composed with 30 bi-layers demonstrated an absolute efficiency of 37.6percent in the 3rd diffraction order at 13.6 nm wavelength. The groove profile of the grating was thoroughly characterized with atomic force microscopy before and after the multilayer deposition. The obtained metrology data were used for simulation of the grating efficiency with the vector electromagnetic PCGrate-6.1 code. The simulations showed that smoothing of the grating profile during the multilayer deposition is the main reason for efficiency losses compared to the theoretical maximum. Investigation of the grating with cross-sectional transmission electron microscopy revealed a complex evolution of the groove profile in the course of the multilayer deposition. Impact of the shadowing and smoothing processes on growth of the multilayer on the surface of the sawtooth substrate is discussed.

Multilayered samples reconstructed by measuring Kα/Kβ or Lα/Lβ X-ray intensity ratios by EDXRF

Science.gov (United States)

Cesareo, Roberto; de Assis, Joaquim T.; Roldán, Clodoaldo; Bustamante, Angel D.; Brunetti, Antonio; Schiavon, Nick

2013-10-01

In this paper a general method based on energy-dispersive X-ray fluorescence (EDXRF) analysis has been tested to assess its possible use as a tool to reconstruct the structure and determine the thickness of two and/or multi-layered materials. The method utilizes the X-ray intensity ratios of Kα/Kβ or Lα/Lβ peaks (or the ratio of these peaks) for selected elements present in multi-layered objects of various materials (Au alloys, gilded Cu, gilded Ag, gilded Pb, Ag-Au Tumbaga, stone surfaces with protective treatments, Zn or Nickel plating on metals). Results show that, in the case of multi-layered samples, a correct calculation of the peak ratio (Kα /Kβ and/or Lα/Lβ) of relevant elements from energy-dispersive X-ray fluorescence spectra, can provide important information in assessing the exact location of each layer and for calculating its thickness. The methodological approach shown may have important applications not only in materials science but also when dealing with the conservation and restoration of multi-layered cultural heritage objects where the use of a Non-Destructive techniques to determine slight chemical and thickness variations in the layered structure is often of paramount importance to achieve the best results.

Thickness measurement of multilayered samples by Kα/Kβ or Lα/Lβ X-ray ratios

Energy Technology Data Exchange (ETDEWEB)

Cesareo, Roberto; Brunetti, Antonio, E-mail: roberto.cesareo@gmail.com, E-mail: brunetti@uniss.it [Universita di Sassari (UNISS), Sassari, (Italy); Assis, Joaquim T. de, E-mail: rcbarros@pq.cnpq.br [Universidade do Estado do Rio de Janeiro (UERJ), Rio de Janeiro, RJ (Brazil)

2013-07-01

Objects composed of two or more layers are relatively common among industrial and electronic materials, works of art and common tools. For example plated objects (with zinc, nickel, silver, gold) are composed of two or three layers, a painting is generally composed of several layers, a decorated vase is composed of two or three layers, just as a stone, marble or bronze covered with a protective layer. In this paper a general method and some results are described to reconstruct structure and to determine thicknesses of multilayered material, when energy dispersive X-ray fluorescence is employed to analyze the material: the X-ray ratios of Kα/Kβ and Lα/Lβ for elements present in the multilayered samples are employed. (author)

Thickness measurement of multilayered samples by Kα/Kβ or Lα/Lβ X-ray ratios

International Nuclear Information System (INIS)

Cesareo, Roberto; Brunetti, Antonio; Assis, Joaquim T. de

2013-01-01

Objects composed of two or more layers are relatively common among industrial and electronic materials, works of art and common tools. For example plated objects (with zinc, nickel, silver, gold) are composed of two or three layers, a painting is generally composed of several layers, a decorated vase is composed of two or three layers, just as a stone, marble or bronze covered with a protective layer. In this paper a general method and some results are described to reconstruct structure and to determine thicknesses of multilayered material, when energy dispersive X-ray fluorescence is employed to analyze the material: the X-ray ratios of Kα/Kβ and Lα/Lβ for elements present in the multilayered samples are employed. (author)

Numerical simulation of SPH for dynamics effect of multilayer discontinuous structure irradiated by impulse X-ray

International Nuclear Information System (INIS)

Xu Binbin; Tang Wenhui; Ran Xianwen; Xu Zhihong; Chen Hua

2012-01-01

When high energy X-ray irradiates material, it will cause energy deposition in materials, and generates thermal shock wave. At present, finite difference method is used to the numerical simulation of thermal shock usually, but if considering the inter-space between the multilayer materials, the difference method will be more difficult. This paper used the SPH method to simulate multilayer discontinuous structure irradiated by high energy X-ray, and the results show that the gap between the materials of each layer has a certain influence on the thermal shock wave intensity, but doesn't have any affect to gasification impulse. (authors)

Investigation of aperiodic W/C multi-layer mirror for X-ray optics

International Nuclear Information System (INIS)

Wang Zhanshan; Cheng Xinbin; Zhu Jingtao; Huang Qiushi; Zhang Zhong; Chen Lingyan

2011-01-01

Design, fabrication and characterization of aperiodic tungsten/carbon (W/C) multi-layer mirror were studied. W/C multi-layer was designed as a broad-angle reflective supermirror for Cu-Kα line (λ = 0.154 nm) in the grazing incident angular range (0.9-1.1 deg.) using simulated annealing algorithm. To deposit the W/C depth-graded multi-layer mirror accurately, we introduce an effective layer growth rate as a function of layer thickness. This method greatly improves the reflectivity curve compared to the conventional multi-layer mirror prepared with constant growth rate. The deposited multi-layer mirror exhibits an average reflectivity of 19% over the grazing incident angle range of 0.88-1.08 deg. which mainly coincides with the designed value. Furthermore, the physical mechanisms were discussed and the re-sputtering process of light-atom layers is accounted for the modification of layer thicknesses which leads to the effective growth rates. Using this calibration method, the aperiodic multi-layer mirrors can be better fabricated for X-ray optics.

Hard synchrotron radiation scattering from a nonideal surface grating from multilayer X-ray mirrors

International Nuclear Information System (INIS)

Punegov, V.I.; Nesterets, Ya.I.; Mytnichenko, S.V.; Kovalenko, N.V.; Chernov, V.A.

2003-01-01

The hard synchrotron radiation scattering from a multilayer surface grating is theoretically and experimentally investigated. The numerical calculations of angular distribution of scattering intensity from X-ray mirror Ni/C are executed with use of recurrence formulae and statistical dynamical theory of diffraction. It is shown, that the essential role in formation of a diffraction pattern plays a diffuse scattering caused by structure imperfection of a multilayer grating [ru

Magnetic and structural properties of Fe/Pd multilayers studied by magnetic x-ray dichroism and x-ray absorption spectroscopy

International Nuclear Information System (INIS)

Mini, S.M.; Fullerton, E.E.; Sowers, C.H.; Fontaine, A.; Pizzini, S.; Bommannavar, A.S.; Traverse, A.; Baudelet, F.

1994-12-01

The results of magnetic circular x-ray dichroism (MCXD) measurements and extended x-ray absorption fine structure measurements (EXAFS) of the Fe K-edges of textured Fe(110)/Pd(111) multilayers are reported. The EXAFS results indicates that the iron in the system goes from bcc to a more densely packed system as the thickness of the iron layer is decreased. The magnetic properties were measured by SQUID magnetometry from 5-350 K. For all the samples, the saturation magnetization was significantly enhanced over the bulk values indicating the interface Pd atoms are polarized by the Fe layer. The enhancement corresponds to a moment of ∼2.5μ B per interface Pd atom

Numerical simulation studies of the blowoff impulse induced by X-ray radiation in multilayer discontinuous material

International Nuclear Information System (INIS)

Tan Xiaoli; Ding Sheng

2010-01-01

In order to study the blowoff impulse induced by X-Ray radiation in new type compound material, the inhomogeneous reticular layers in a kind of multilayer discontinuous material were dealt with the equivalent method. So it could be simulated by method of continuum dynamics. The blowoff impulse in this material induced by irradiating of the blackbody spectral X-Ray was studied using numerical simulation method, and was compared with the result in LY-12Al. The changing discipline of the blowoff impulse along with the spectrum of X-Ray, the energy density and the type of material was analyzed. The main conclusions are: (1) the characteristic of energy deposition in material deciding by the spectrum of X-Ray is the ultimate cause of the magnitude of blowoff impulse; (2) for same spectrum and same material, higher energy density will cause more blowoff impulse, but the coupling coefficient of blowoff impulse is almost constant; (3) for same loading, the coupling coefficient of blowoff impulse of multilayer discontinuous material is bigger than that of LY-12Al. (authors)

Feasibility of X-ray analysis of multi-layer thin films at a single beam voltage

International Nuclear Information System (INIS)

Statham, P J

2010-01-01

Multi-layer analysis using electron beam excitation and X-ray spectrometry is a powerful tool for characterising layers down to 1 nm thickness and with typically 1 μm lateral resolution but does not always work. Most published applications have used WDS with many measurements at different beam voltages and considerable experience has been needed to choose lines and voltages particularly for complex multi-layer problems. A new objective mathematical approach is described which demonstrates whether X-ray analysis can obtain reliable results for an arbitrary multi-layer problem. A new algorithm embodied in 'ThinFilmID' software produces a single plot that shows feasibility of achieving results with a single EDS spectrum and suggests the optimal beam voltage. Synthesis of EDS spectra allows the precision in results to be estimated and acquisition conditions modified before wasting valuable instrument time. Thus, practicality of multi-layer thin film analysis at a single beam voltage can now be established without the extensive experimentation that was previously required by a microanalysis expert. Examples are shown where the algorithm discovers viable single-voltage conditions for applications that experts previously thought could only be addressed using measurements at more than one beam voltage.

Multi-layer thickness determination using differential-based enhanced Fourier transforms of X-ray reflectivity data

Energy Technology Data Exchange (ETDEWEB)

Poust, Benjamin [Department of Materials Science and Engineering, University of California, Los Angeles, CA (United States); Northrop Grumman Space Technology, Redondo Beach, CA (United States); Sandhu, Rajinder [Northrop Grumman Space Technology, Redondo Beach, CA (United States); Goorsky, Mark [Department of Materials Science and Engineering, University of California, Los Angeles, CA (United States)

2009-08-15

Layer thickness determination of single and multi-layer structures is achieved using a new method for generating Fourier transforms (FTs) of X-ray reflectivity data. This enhanced Fourier analysis is compared to other techniques in the determination of AlN layer thickness deposited on sapphire. In addition to demonstrably improved results, the results also agree with thicknesses determined using simulations and TEM measurements. The effectiveness of the technique is further demonstrated using the more complicated metamorphic epitaxial multi-layer AlSb/InAs structures deposited on GaAs. The approach reported here is based upon differentiating the specular intensity with respect to the vertical reciprocal space coordinate Q{sub Z}. In general, differentiation is far more effective at removing the sloping background present in reflectivity scans than logarithmic compression alone, average subtraction alone, or other methods. When combined with any of the other enhancement techniques, however, differentiation yields distinguishable discrete Fourier transform (DFT) power spectrum peaks for even the weakest and most truncated of sloping oscillations that are present in many reflectivity scans from multi-layer structures. (Abstract Copyright [2009], Wiley Periodicals, Inc.)

Carrier recombination in tailored multilayer Si/Si{sub 1−x}Ge{sub x} nanostructures

Energy Technology Data Exchange (ETDEWEB)

Mala, S.A. [Department of Electrical and Computer Engineering, New Jersey Institute of Technology, Newark, NJ 07102 (United States); Tsybeskov, L., E-mail: tsybesko@njit.edu [Department of Electrical and Computer Engineering, New Jersey Institute of Technology, Newark, NJ 07102 (United States); Lockwood, D.J.; Wu, X.; Baribeau, J.-M. [National Research Council, Ottawa, ON, Canada KIA 0R6 (Canada)

2014-11-15

Photoluminescence (PL) measurements were performed in Si/Si{sub 1−x}Ge{sub x} nanostructures with a single Si{sub 0.92}Ge{sub 0.08} nanometer-thick layer incorporated into Si/Si{sub 0.6}Ge{sub 0.4} cluster multilayers. Under pulsed laser excitation, the PL decay associated with the Si{sub 0.92}Ge{sub 0.08} nano-layer is found to be nearly a 1000 times faster compared to that in Si/Si{sub 0.6}Ge{sub 0.4} cluster multilayers. A model considering Si/SiGe hetero-interface composition and explaining the fast and slow time-dependent recombination rates is proposed.

A high-quality multilayer structure characterization method based on X-ray fluorescence and Monte Carlo simulation

Energy Technology Data Exchange (ETDEWEB)

Brunetti, Antonio; Golosio, Bruno [Universita degli Studi di Sassari, Dipartimento di Scienze Politiche, Scienze della Comunicazione e Ingegneria dell' Informazione, Sassari (Italy); Melis, Maria Grazia [Universita degli Studi di Sassari, Dipartimento di Storia, Scienze dell' Uomo e della Formazione, Sassari (Italy); Mura, Stefania [Universita degli Studi di Sassari, Dipartimento di Agraria e Nucleo di Ricerca sulla Desertificazione, Sassari (Italy)

2014-11-08

X-ray fluorescence (XRF) is a well known nondestructive technique. It is also applied to multilayer characterization, due to its possibility of estimating both composition and thickness of the layers. Several kinds of cultural heritage samples can be considered as a complex multilayer, such as paintings or decorated objects or some types of metallic samples. Furthermore, they often have rough surfaces and this makes a precise determination of the structure and composition harder. The standard quantitative XRF approach does not take into account this aspect. In this paper, we propose a novel approach based on a combined use of X-ray measurements performed with a polychromatic beam and Monte Carlo simulations. All the information contained in an X-ray spectrum is used. This approach allows obtaining a very good estimation of the sample contents both in terms of chemical elements and material thickness, and in this sense, represents an improvement of the possibility of XRF measurements. Some examples will be examined and discussed. (orig.)

A high-quality multilayer structure characterization method based on X-ray fluorescence and Monte Carlo simulation

International Nuclear Information System (INIS)

Brunetti, Antonio; Golosio, Bruno; Melis, Maria Grazia; Mura, Stefania

2015-01-01

X-ray fluorescence (XRF) is a well known nondestructive technique. It is also applied to multilayer characterization, due to its possibility of estimating both composition and thickness of the layers. Several kinds of cultural heritage samples can be considered as a complex multilayer, such as paintings or decorated objects or some types of metallic samples. Furthermore, they often have rough surfaces and this makes a precise determination of the structure and composition harder. The standard quantitative XRF approach does not take into account this aspect. In this paper, we propose a novel approach based on a combined use of X-ray measurements performed with a polychromatic beam and Monte Carlo simulations. All the information contained in an X-ray spectrum is used. This approach allows obtaining a very good estimation of the sample contents both in terms of chemical elements and material thickness, and in this sense, represents an improvement of the possibility of XRF measurements. Some examples will be examined and discussed. (orig.)

Mechanical properties of highly textured Cu/Ni multilayers

International Nuclear Information System (INIS)

Liu, Y.; Bufford, D.; Wang, H.; Sun, C.; Zhang, X.

2011-01-01

We report on the synthesis of highly (1 1 1) and (1 0 0) textured Cu/Ni multilayers with individual layer thicknesses, h, varying from 1 to 200 nm. When, h, decreases to 5 nm or less, X-ray diffraction spectra show epitaxial growth of Cu/Ni multilayers. High resolution transmission electron microscopy studies show the coexistence of nanotwins and coherent layer interfaces in highly (1 1 1) textured Cu/Ni multilayers with smaller h. Hardnesses of multilayer films increase with decreasing h, approach a maximum at h of a few nanometers, and show softening thereafter at smaller h. The influence of layer interfaces as well as twin interfaces on strengthening mechanisms of multilayers and the formation of twins in Ni in multilayers are discussed.

Reactive diffusion in Sc/Si multilayer X-ray mirrors with CrB2 barrier layers

International Nuclear Information System (INIS)

Pershyn, Y.P.; Zubarev, E.N.; Kondratenko, V.V.; Sevryukova, V.A.; Kurbatova, S.V.

2011-01-01

Processes undergoing in Sc/Si multilayer X-ray mirrors (MXMs) with periods of ∝27 nm and barrier layers of CrB 2 0.3- and 0.7-nm thick within the temperature range of 420-780 K were studied by methods of small-angle X-ray reflectivity (λ=0.154 nm) and cross-sectional transmission electron microscopy. All layers with the exception of Sc ones are amorphous. Barrier layers are stable at least up to a temperature of 625 K and double the activation energy of diffusional intermixing at moderate temperatures. Introduction of barriers improves the thermal stability of Sc/Si MXMs at least by 80 degrees. Diffusion of Si atoms through barrier layers into Sc layers with formation of silicides was shown to be the main degradation mechanism of MXMs. A comparison of the stability for Sc/Si MXMs with different barriers published in the literature is conducted. The ways of further improvement of barrier properties are discussed. (orig.)

EUV soft X-ray characterization of a FEL multilayer optics damaged by multiple shot laser beam

International Nuclear Information System (INIS)

Giglia, A.; Mahne, N.; Bianco, A.; Svetina, C.; Nannarone, S.

2011-01-01

We have investigated the damaging effects of a femtosecond pulsed laser beam with 400 nm wavelength on a Mo/Si EUV multilayer. The exposures have been done in vacuum with multiple pulses (5 pulses/mm 2 ) of 120 fs varying the laser fluence in the 38-195 mJ/cm 2 range. The analysis of the different irradiated regions has been performed ex-situ by means of different techniques, including specular and diffuse reflectivity, X-ray photoemission spectroscopy (XPS) and total electron yield (TEY) in the EUV and soft X-ray range. Surface images have been acquired by atomic force microscopy (AFM) and scanning electron microscopy (SEM). Results clearly indicate a progressive degradation of the EUV multilayer performances with the increase of the laser fluence. Spectroscopic analysis allowed to correlate the decrease of reflectivity with the degradation of the multilayer stacking, ascribed to Mo-Si intermixing at the Mo/Si interfaces of the first layers, close to the surface of the mirror.

High Reflectance Nanoscale V/Sc Multilayer for Soft X-ray Water Window Region.

Science.gov (United States)

Huang, Qiushi; Yi, Qiang; Cao, Zhaodong; Qi, Runze; Loch, Rolf A; Jonnard, Philippe; Wu, Meiyi; Giglia, Angelo; Li, Wenbin; Louis, Eric; Bijkerk, Fred; Zhang, Zhong; Wang, Zhanshan

2017-10-10

V/Sc multilayer is experimentally demonstrated for the first time as a high reflectance mirror for the soft X-ray water window region. It primarily works at above the Sc-L edge (λ = 3.11 nm) under near normal incidence while a second peak appears at above the V-L edge (λ = 2.42 nm) under grazing incidence. The V/Sc multilayer fabricated with a d-spacing of 1.59 nm and 30 bilayers has a smaller interface width (σ = 0.27 and 0.32 nm) than the conventional used Cr/Sc (σ = 0.28 and 0.47 nm). For V/Sc multilayer with 30 bilayers, the introduction of B 4 C barrier layers has little improvement on the interface structure. As the number of bilayers increasing to 400, the growth morphology and microstructure of the V/Sc layers evolves with slightly increased crystallization. Nevertheless, the surface roughness remains to be 0.25 nm. A maximum soft X-ray reflectance of 18.4% is measured at λ = 3.129 nm at 9° off-normal incidence using the 400-bilayers V/Sc multilayer. According to the fitted model, an s-polarization reflectance of 5.2% can also be expected at λ = 2.425 nm under 40° incidence. Based on the promising experimental results, further improvement of the reflectance can be achieved by using a more stable deposition system, exploring different interface engineering methods and so on.

Growth, structure, and performance of depth-graded W/Si multilayers for hard x-ray optics

DEFF Research Database (Denmark)

Windt, D.L.; Christensen, Finn Erland; Craig, W.W.

2000-01-01

that the dominant interface imperfection in these films is interfacial diffuseness; interfacial roughness is minimal (sigma(r)similar to 0.175 nm) in structures prepared under optimal conditions, but can increase under conditions in which the beneficial effects of energetic bombardment during growth are compromised......-graded W/Si multilayer structures, and high-resolution transmission electron microscopy (TEM) and selected area electron diffraction (SAED) to characterize the interface structure and layer morphology as a function of depth in an optimized depth-graded multilayer. From x-ray analysis we find interface......), and somewhat larger interface widths (i.e., sigma=0.35-0.4 nm) for structures grown at higher Ar pressures, higher background pressures, or with larger target-to-substrate distances. We find no variation in interface widths with magnetron power. Nonspecular x-ray reflectance analysis and TEM suggest...

Multilayers quantitative X-ray fluorescence analysis applied to easel paintings.

Science.gov (United States)

de Viguerie, Laurence; Sole, V Armando; Walter, Philippe

2009-12-01

X-ray fluorescence spectrometry (XRF) allows a rapid and simple determination of the elemental composition of a material. As a non-destructive tool, it has been extensively used for analysis in art and archaeology since the early 1970s. Whereas it is commonly used for qualitative analysis, recent efforts have been made to develop quantitative treatment even with portable systems. However, the interpretation of the results obtained with this technique can turn out to be problematic in the case of layered structures such as easel paintings. The use of differential X-ray attenuation enables modelling of the various layers: indeed, the absorption of X-rays through different layers will result in modification of intensity ratio between the different characteristic lines. This work focuses on the possibility to use XRF with the fundamental parameters method to reconstruct the composition and thickness of the layers. This method was tested on several multilayers standards and gives a maximum error of 15% for thicknesses and errors of 10% for concentrations. On a painting test sample that was rather inhomogeneous, the XRF analysis provides an average value. This method was applied in situ to estimate the thickness of the layers a painting from Marco d'Oggiono, pupil of Leonardo da Vinci.

Recent Developments in the X-Ray Reflectivity Analysis for Rough Surfaces and Interfaces of Multilayered Thin Film Materials

Directory of Open Access Journals (Sweden)

Yoshikazu Fujii

2013-01-01

Full Text Available X-ray reflectometry is a powerful tool for investigations on rough surface and interface structures of multilayered thin film materials. The X-ray reflectivity has been calculated based on the Parratt formalism, accounting for the effect of roughness by the theory of Nevot-Croce conventionally. However, in previous studies, the calculations of the X-ray reflectivity often show a strange effect where interference effects would increase at a rough surface. And estimated surface and interface roughnesses from the X-ray reflectivity measurements did not correspond to the TEM image observation results. The strange result had its origin in a used equation due to a serious mistake in which the Fresnel transmission coefficient in the reflectivity equation is increased at a rough interface because of a lack of consideration of diffuse scattering. In this review, a new accurate formalism that corrects this mistake is presented. The new accurate formalism derives an accurate analysis of the X-ray reflectivity from a multilayer surface of thin film materials, taking into account the effect of roughness-induced diffuse scattering. The calculated reflectivity by this accurate reflectivity equation should enable the structure of buried interfaces to be analyzed more accurately.

Multilayer optics for monochromatic high-resolution X-ray imaging diagnostic in a broad photon energy range from 2 keV to 22 keV

International Nuclear Information System (INIS)

Troussel, Ph.; Dennetiere, D.; Maroni, R.; Høghøj, P.; Hedacq, S.; Cibik, L.; Krumrey, M.

2014-01-01

The “Commissariat à l’énergie atomique et aux énergies alternatives” (CEA) studies and designs advanced X-ray diagnostics to probe dense plasmas produced at the future Laser MegaJoule (LMJ) facility. Mainly for X-ray imaging with high spatial resolution, different types of multilayer mirrors were developed to provide broadband X-ray reflectance at grazing incidence. These coatings are deposited on two toroidal mirror substrates that are then mounted into a Wolter-type geometry (working at a grazing angle of 0.45°) to realize an X-ray microscope. Non-periodic (depth graded) W/Si multilayer can be used in the broad photon energy range from 2 keV to 22 keV. A third flat mirror can be added for the spectral selection of the microscope. This mirror is coated with a Mo/Si multilayer for which the d-spacing varies in the longitudinal direction to satisfy the Bragg condition within the angular acceptance of the microscope and also to compensate the angular dispersion due to the field of the microscope. We present a study of such a so-called Göbel mirror which was optimized for photon energy of 10.35 keV. The three mirrors were coated using magnetron sputtering technology by Xenocs SA. The reflectance in the entire photon energy range was determined in the laboratory of the Physikalisch-Technische Bundesanstalt (PTB) at the synchrotron radiation facility BESSY II in Berlin

Multilayer optics for monochromatic high-resolution X-ray imaging diagnostic in a broad photon energy range from 2 keV to 22 keV

Energy Technology Data Exchange (ETDEWEB)

Troussel, Ph., E-mail: philippe.troussel@cea.fr [CEA, DAM, DIF, F-91297 Arpajon (France); Dennetiere, D. [Synchrotron Soleil, L’orme des Merisiers, 91190 Saint-Aubin (France); Maroni, R. [CEA, DAM, DIF, F-91297 Arpajon (France); Høghøj, P.; Hedacq, S. [Xenocs SA, 19, rue François Blumet, F-38360 Sassenage (France); Cibik, L.; Krumrey, M. [Physikalisch-Technische Bundesanstalt (PTB), Abbestr. 2-12, 10587 Berlin (Germany)

2014-12-11

The “Commissariat à l’énergie atomique et aux énergies alternatives” (CEA) studies and designs advanced X-ray diagnostics to probe dense plasmas produced at the future Laser MegaJoule (LMJ) facility. Mainly for X-ray imaging with high spatial resolution, different types of multilayer mirrors were developed to provide broadband X-ray reflectance at grazing incidence. These coatings are deposited on two toroidal mirror substrates that are then mounted into a Wolter-type geometry (working at a grazing angle of 0.45°) to realize an X-ray microscope. Non-periodic (depth graded) W/Si multilayer can be used in the broad photon energy range from 2 keV to 22 keV. A third flat mirror can be added for the spectral selection of the microscope. This mirror is coated with a Mo/Si multilayer for which the d-spacing varies in the longitudinal direction to satisfy the Bragg condition within the angular acceptance of the microscope and also to compensate the angular dispersion due to the field of the microscope. We present a study of such a so-called Göbel mirror which was optimized for photon energy of 10.35 keV. The three mirrors were coated using magnetron sputtering technology by Xenocs SA. The reflectance in the entire photon energy range was determined in the laboratory of the Physikalisch-Technische Bundesanstalt (PTB) at the synchrotron radiation facility BESSY II in Berlin.

Multilayer optics for monochromatic high-resolution X-ray imaging diagnostic in a broad photon energy range from 2 keV to 22 keV

Science.gov (United States)

Troussel, Ph.; Dennetiere, D.; Maroni, R.; Høghøj, P.; Hedacq, S.; Cibik, L.; Krumrey, M.

2014-12-01

The "Commissariat à l'énergie atomique et aux énergies alternatives" (CEA) studies and designs advanced X-ray diagnostics to probe dense plasmas produced at the future Laser MegaJoule (LMJ) facility. Mainly for X-ray imaging with high spatial resolution, different types of multilayer mirrors were developed to provide broadband X-ray reflectance at grazing incidence. These coatings are deposited on two toroidal mirror substrates that are then mounted into a Wolter-type geometry (working at a grazing angle of 0.45°) to realize an X-ray microscope. Non-periodic (depth graded) W/Si multilayer can be used in the broad photon energy range from 2 keV to 22 keV. A third flat mirror can be added for the spectral selection of the microscope. This mirror is coated with a Mo/Si multilayer for which the d-spacing varies in the longitudinal direction to satisfy the Bragg condition within the angular acceptance of the microscope and also to compensate the angular dispersion due to the field of the microscope. We present a study of such a so-called Göbel mirror which was optimized for photon energy of 10.35 keV. The three mirrors were coated using magnetron sputtering technology by Xenocs SA. The reflectance in the entire photon energy range was determined in the laboratory of the Physikalisch-Technische Bundesanstalt (PTB) at the synchrotron radiation facility BESSY II in Berlin.

Interferential multi-layer mirrors for X-UV radiation: fabrication, characterization and applications

International Nuclear Information System (INIS)

Youn Ki Byoung

1987-01-01

This research thesis reports the fabrication of W/C, Ni/C and Mo/C interferential multi-layer mirrors which can be used in the X-UV domain. They have been manufactured by cathodic pulverisation by using a new system for the in-situ control of the thickness of deposited layers, based on the measurement, sampling and real time integration of the ionic current which goes through the target during the coating process. Different methods (X ray diffraction at different wavelengths, electron microscopy and diffraction, in situ electronic resistivity measurement) have been used to study the main parameters which govern the multi-layer reflectivity: structure, substrate and interface roughness, minimum thickness to be deposited to obtain a continuous layer, number of bi-layers, stacking evenness, rate of absorbent element thickness to the period. Absolute reflectivity measurements have been performed by using short wavelength synchrotron radiation and the S component of polarised soft X rays obtained after double reflection on two parallel multi-layer mirrors oriented according to the Brewster angle. Ferromagnetic properties of Ni/C multi-layers have been studied to investigate fundamental magnetic properties, and to obtain additional information on interface structure [fr

Performance limitations of imaging microscopes for soft x-ray applications

International Nuclear Information System (INIS)

Lewotsky, K.L.; Kotha, A.; Harvey, J.E.

1993-01-01

Recent advances in the fabrication of nanometer-scale multilayer structures have yielded high-reflectance mirrors operating at near-normal incidence for soft X-ray wavelengths. These developments have stimulated renewed interest in high-resolution soft X-ray microscopy. The design of a Schwarzschild imaging microscope for soft X-ray applications has been reported by Hoover and Shealy. Based upon a geometrical ray-trace analysis of the residual design errors, diffraction-limited performance at a wavelength of 100 angstrom was predicted over an object size (diameter) of 0.4 mm. In this paper the authors expand upon the previous analysis of the Schwarzschild X-ray microscope design by determining the total image degradation due to diffraction, geometrical aberrations, alignment errors, and realistic assumptions concerning optical fabrication errors. NASA's Optical Surface Analysis Code (OSAC) is used to model the image degradation effects of residual surface irregularities over the entire range of relevant spatial frequencies. This includes small angle scattering effects due to mid spatial frequency surface errors falling between the traditional figure and finish specifications. Performance predictions are presented parametrically to provide some insight into the optical fabrication and alignment tolerances necessary to meet a particular image quality requirement

Full Multilayer Laue Lens for Focusing Hard X-rays

International Nuclear Information System (INIS)

Liu Chian; Shi, B.; Qian, J.; Conley, R.; Yan, H.; Wieczorek, M.; Macrander, A. T.; Maser, J.; Stephenson, G. B.

2010-01-01

Multilayer Laue Lenses (MLLs) were developed by us using dynamic diffraction effects to efficiently focus hard x-rays to very small spots. Using a partial MLL we were able to focus 19.5-keV hard x-rays to a line focus of 16 nm with an efficiency of 31%. A full MLL is a complete linear MLL structure. It can be fabricated by bonding two partial MLL wafers, or by growing the full structure using magnetron sputtering without bonding. A 40-μm full MLL, with a total of 5166 layers of WSi 2 and Si, has been successfully grown by sputter deposition. The layer thicknesses gradually vary from 4 nm to ∼400 nm and then back to 4 nm. Two coating runs were used to grow the full structure, one for each half. It took over 56 h for each run. A 100-μm nearly-full MLL was constructed by bonding. Each 50-μm half-structure has 1788 WSi 2 and Si layers with 12-nm to ∼32-nm thicknesses and ∼32-μm total thickness, followed by a thick WSi 2 layer of ∼17 μm, and an AuSn layer of ∼1 μm. Both full MLL structures survived dicing and polishing. The primary results demonstrate the feasibility and potential of a full MLL with a doubled numerical aperture and large beam acceptance for hard x-rays.

Nitridation and contrast of B4C/La interfaces and X-ray multilayer optics

NARCIS (Netherlands)

Tsarfati, T.; van de Kruijs, Robbert Wilhelmus Elisabeth; Zoethout, E.; Bijkerk, Frederik

2010-01-01

Chemical diffusion and interlayer formation in thin layers and at interfaces is of increasing influence in nanoscopic devices such as nano-electronics, magneto-optical storage and multilayer X-ray optics. We show that with the nitridation of reactive B4C/La interfaces, both the chemical and optical

Development and production of a multilayer-coated x-ray reflecting stack for the Athena mission

Science.gov (United States)

Massahi, S.; Ferreira, D. D. M.; Christensen, F. E.; Shortt, B.; Girou, D. A.; Collon, M.; Landgraf, B.; Barriere, N.; Krumrey, M.; Cibik, L.; Schreiber, S.

2016-07-01

The Advanced Telescope for High-Energy Astrophysics, Athena, selected as the European Space Agency's second large-mission, is based on the novel Silicon Pore Optics X-ray mirror technology. DTU Space has been working for several years on the development of multilayer coatings on the Silicon Pore Optics in an effort to optimize the throughput of the Athena optics. A linearly graded Ir/B4C multilayer has been deposited on the mirrors, via the direct current magnetron sputtering technique, at DTU Space. This specific multilayer, has through simulations, been demonstrated to produce the highest reflectivity at 6 keV, which is a goal for the scientific objectives of the mission. A critical aspect of the coating process concerns the use of photolithography techniques upon which we will present the most recent developments in particular related to the cleanliness of the plates. Experiments regarding the lift-off and stacking of the mirrors have been performed and the results obtained will be presented. Furthermore, characterization of the deposited thin-films was performed with X-ray reflectometry at DTU Space and in the laboratory of the Physikalisch-Technische Bundesanstalt at the synchrotron radiation facility BESSY II.

Soft X-ray magnetic scattering study of rotational magnetisation processes in cobalt/copper multilayers

International Nuclear Information System (INIS)

Hase, T.P.A.; Fulthorpe, B.D.; Wilkins, S.B.; Tanner, B.K.; Marrows, C.H.; Hickey, B.J.

2001-01-01

We report the observation of magnetic viscosity in the intensity of resonant magnetic soft X-ray scattering during rotational magnetisation processes in antiferromagnetically coupled Co/Cu multilayers. The hysteretic time-dependent component of the signal can be fitted to a single-exponential function that varies as a function of magnetising field

Thermal stress prediction in mirror and multilayer coatings.

Science.gov (United States)

Cheng, Xianchao; Zhang, Lin; Morawe, Christian; Sanchez Del Rio, Manuel

2015-03-01

Multilayer optics for X-rays typically consist of hundreds of periods of two types of alternating sub-layers which are coated on a silicon substrate. The thickness of the coating is well below 1 µm (tens or hundreds of nanometers). The high aspect ratio (∼10(7)) between the size of the optics and the thickness of the multilayer can lead to a huge number of elements (∼10(16)) for the numerical simulation (by finite-element analysis using ANSYS code). In this work, the finite-element model for thermal-structural analysis of multilayer optics has been implemented using the ANSYS layer-functioned elements. The number of meshed elements is considerably reduced and the number of sub-layers feasible for the present computers is increased significantly. Based on this technique, single-layer coated mirrors and multilayer monochromators cooled by water or liquid nitrogen are studied with typical parameters of heat-load, cooling and geometry. The effects of cooling-down of the optics and heating of the X-ray beam are described. It is shown that the influences from the coating on temperature and deformation are negligible. However, large stresses are induced in the layers due to the different thermal expansion coefficients between the layer and the substrate materials, which is the critical issue for the survival of the optics. This is particularly true for the liquid-nitrogen cooling condition. The material properties of thin multilayer films are applied in the simulation to predict the layer thermal stresses with more precision.

Metal location and thickness in a multilayered sheet by measuring Kα/Kβ, Lα/Lβ and Lα/Lγ X-ray ratios

International Nuclear Information System (INIS)

Cesareo, Roberto; Rizzutto, Marcia A.; Brunetti, Antonio; Rao, Donepudi V.

2009-01-01

When a multilayered material is analyzed by means of energy-dispersive X-ray fluorescence analysis, then the X-ray ratios of Kα/Kβ, or Lα/Lβ and Lα/Lγ, for an element in the multilayered material, depend on the composition and thickness of the layer in which the element is situated, and on the composition and thickness of the superimposed layer (or layers). Multilayered samples are common in archaeometry, for example, in the case of pigment layers in paintings, or in the case of gilded or silvered alloys. The latter situation is examined in detail in the present paper, with a specific reference to pre-Columbian alloys from various museums in the north of Peru.

Ordering phenomena in FeCo-films and Fe/Cr-multilayers: an X-ray and neutron scattering study

Energy Technology Data Exchange (ETDEWEB)

Nickel, B.

2001-07-01

The following topics are covered: critical phenomena in thin films, critical adsorption, finite size scaling, FeCo Ising model, kinematical scattering theory for thin films, FeCo thin films, growth and characterisation of single crystal FeCo thin films, X-ray study of ordering in FeCo films, antiferromagnetic coupling in Fe/Cr multilayers, neutron scattering on Fe/Cr multilayers (WL)

Multilayer beam splitter used in a soft X-ray Mach-Zehnder interferometer at working wavelength of 13.9 nm

International Nuclear Information System (INIS)

Zhang Zhong; Wang Zhanshan; Wang Hongchang; Wang Fengli; Wu Wenjuan; Zhang Shumin; Qin Shuji; Chen Lingyan

2006-01-01

The soft X-ray Mach-Zehnder interferometer is an important tool in measuring the electron densities of laser-produced plasma near the critical surface. The design, fabrication and characterization of multilayer beam splitters at 13.9 nm for soft X-ray Mach-Zehnder interferometer are presented in the paper. The design of beam splitter is completed based on the standard of maximizing product of reflectivity and transmission of the beam splitter at 13.9 nm. The beam splitters, which are Mo/Si multi-layer deposited on 10 mm x 10 mm area, 100 nm thickness Si 3 N 4 membranes, are fabricated using the magnetron sputtering. A method based on extended He-Ne laser beam is developed to analyze the figure error of the beam splitters. The data measured by an optical profiler prove that the method based on visible light is effective to analyze the figure of the beam splitters. The rms figure error of a beam splitter reaches 1.757 nm in the center area 3.82 mm x 3.46 mm and satisfies the need of soft X-ray interference experiment. The product of reflectivity and transmission measured by synchrotron radiation is near to 4%. The Mach-Zehnder interferometer at 13.9 nm based on the multilayer beam splitters is used in 13.9 nm soft X-ray laser interference experiment, in which a clear interferograms of C 8 H 8 laser-produced plasma is got. (authors)

Mechanical design of ultraprecision weak-link stages for nanometer-scale x-ray imaging

Energy Technology Data Exchange (ETDEWEB)

Shu, D [APS Engineering Support Division, Argonne National Laboratory, Argonne, IL 60439 (United States); Maser, J, E-mail: shu@aps.anl.go [Center for Nanoscale Materials, Argonne National Laboratory, Argonne, IL 60439 (United States)

2009-09-01

A nanopositioning diagnostic setup has been built to support the Argonne Center for Nanoscale Materials (CNM) nanoprobe instrument commissioning process at the APS. Its laser Doppler interferometer system provides subnanometer positioning diagnostic resolution with large dynamic range. A set of original APS designed ultraprecision PZT-driven weak-link stages with high-stiffness motor-driven stages has been tested with this diagnostic setup. In this paper we present a preliminary test result of the ultraprecision weak-link stage system developed for the CNM hard x-ray nanoprobe instrument at APS sector 26. A test result for a novel laminar weak-link mechanism with sub-centimeter travel range and sub-nanometer positioning resolution is also introduced in this paper as a future work.

High resolution x-ray microscope

OpenAIRE

Gary, C. K.; Park, H.; Lombardo, L. W.; Piestrup, M. A.; Cremer, J. T.; Pantell, R. H.; Dudchik, Y. I.

2007-01-01

The authors present x-ray images of grid meshes and biological material obtained using a microspot x-ray tube with a multilayer optic and a 92-element parabolic compound refractive lens CRL made of a plastic containing only hydrogen and carbon. Images obtained using this apparatus are compared with those using an area source with a spherical lens and a spherical lens with multilayer condenser. The authors found the best image quality using the multilayer condenser with a parabolic lens, com...

Development of multilayer optics for X-ray broadband spectrometry of plasma emission

International Nuclear Information System (INIS)

Emprin, Benoit

2014-01-01

Within the framework of the research on inertial confinement fusion, the 'Commissariat a l'energie atomique et aux energies alternatives' has studied and implemented an absolute calibrated time-Resolved broadband soft x-Ray spectrometer, called 'Diagnostic de Mesure du rayonnement X'. This diagnostic, composed of 20 measurement channels, measures the emitted radiant power from a laser created plasma in the range from 50 eV to 20 keV. We have developed additional measurement channels to obtain redundancy and an improvement in measurement accuracy. The principle of these new channels is based on an original concept to obtain spectral bounded flat-Responses. Two channels have been developed for the 2 - 4 keV and 4 - 6 keV spectral ranges, using aperiodic multilayer mirrors made at the 'Laboratoire Charles Fabry' with Cr/Sc and Ni/W/SiC/W layers respectively. These mirrors were characterized at synchrotron radiation facilities and integrated into the spectrometer. The two new channels were used during laser-Plasma experimental campaigns at the OMEGA laser facility in Rochester (USA). This allowed us to determine directly the radiant power with only one measurement within a certain spectral band, and with a better precision when compared with using standard channels. The results, in good agreement with the standard measurement channels, allowed us to validate the use of aperiodic multilayer mirrors for X-Ray broadband spectrometry. (author) [fr

Probing buried solid-solid interfaces in magnetic multilayer structures and other nanostructures using spectroscopy excited by soft x-ray standing waves

International Nuclear Information System (INIS)

Yang, S.-H.; Mun, B.S.; Mannella, N.; Sell, B.; Ritchey, S.B.; Fadley, C.S.; Pham, L.; Nambu, A.; Watanabe, M.

2004-01-01

Full text: Buried solid-solid interfaces are becoming increasingly more important in all aspects of nanoscience, and we here dis- cuss the st applications of a new method for selectively studying them with the vuv/soft x-ray spectroscopies. As specific examples, magnetic multilayer structures represent key elements of current developments in spintronics, including giant magnetoresistance, exchange bias, and magnetic tunnel resistance. The buried interfaces in such structures are of key importance to their performance, but have up to now been difficult to study selectively with these spectroscopies. This novel method involves excitation of photoelectrons or fluorescent x-rays with soft x-ray standing waves created by Bragg reflection from a multilayer mirror substrate on which the sample is grown. We will discuss core and valence photoemission, as well soft x-ray emission, results from applying this method to multilayer structures relevant to both giant magnetoresistance (Fe/Cr-[2]) and magnetic tunnel junctions (Al 2 O 3 /FeCo) , including magnetic dichroism measurements. Work supported by the Director, Of e of Science, Of e of Basic Energy Sciences, Materials Science and Engineering Division, U.S. Department of Energy, Contract No. DE-AC03-76SF000

Efficient focusing of 8 keV X-rays with multilayer Fresnel zone plates fabricated by atomic layer deposition and focused ion beam milling

International Nuclear Information System (INIS)

Mayer, Marcel; Keskinbora, Kahraman; Grévent, Corinne; Szeghalmi, Adriana; Knez, Mato; Weigand, Markus; Snigirev, Anatoly; Snigireva, Irina; Schütz, Gisela

2013-01-01

The fabrication and performance of multilayer Al 2 O 3 /Ta 2 O 5 Fresnel zone plates in the hard X-ray range and a discussion of possible future developments considering available materials are reported. Fresnel zone plates (FZPs) recently showed significant improvement by focusing soft X-rays down to ∼10 nm. In contrast to soft X-rays, generally a very high aspect ratio FZP is needed for efficient focusing of hard X-rays. Therefore, FZPs had limited success in the hard X-ray range owing to difficulties of manufacturing high-aspect-ratio zone plates using conventional techniques. Here, employing a method of fabrication based on atomic layer deposition (ALD) and focused ion beam (FIB) milling, FZPs with very high aspect ratios were prepared. Such multilayer FZPs with outermost zone widths of 10 and 35 nm and aspect ratios of up to 243 were tested for their focusing properties at 8 keV and shown to focus hard X-rays efficiently. This success was enabled by the outstanding layer quality thanks to ALD. Via the use of FIB for slicing the multilayer structures, desired aspect ratios could be obtained by precisely controlling the thickness. Experimental diffraction efficiencies of multilayer FZPs fabricated via this combination reached up to 15.58% at 8 keV. In addition, scanning transmission X-ray microscopy experiments at 1.5 keV were carried out using one of the multilayer FZPs and resolved a 60 nm feature size. Finally, the prospective of different material combinations with various outermost zone widths at 8 and 17 keV is discussed in the light of the coupled wave theory and the thin-grating approximation. Al 2 O 3 /Ir is outlined as a promising future material candidate for extremely high resolution with a theoretical efficiency of more than 20% for as small an outermost zone width as 10 nm at 17 keV

Small d-spacing WC/SiC multilayers for future hard X-ray telescope designs

DEFF Research Database (Denmark)

Jensen, C.P.; Madsen, K.K.; Christensen, Finn Erland

2005-01-01

Multilayer coatings for reflecting hard X-rays up to 80keV, like W/Si and Pt/C, have been studied for several years. To go to higher energies, in the range of 100 keV to 250 keV, one needs coatings with smaller d-spacings than can currently be made with these material combinations, and a lower...

Chirality in Magnetic Multilayers Probed by the Symmetry and the Amplitude of Dichroism in X-Ray Resonant Magnetic Scattering

Science.gov (United States)

Chauleau, Jean-Yves; Legrand, William; Reyren, Nicolas; Maccariello, Davide; Collin, Sophie; Popescu, Horia; Bouzehouane, Karim; Cros, Vincent; Jaouen, Nicolas; Fert, Albert

2018-01-01

Chirality in condensed matter has recently become a topic of the utmost importance because of its significant role in the understanding and mastering of a large variety of new fundamental physical mechanisms. Versatile experimental approaches, capable to reveal easily the exact winding of order parameters, are therefore essential. Here we report x-ray resonant magnetic scattering as a straightforward tool to reveal directly the properties of chiral magnetic systems. We show that it can straightforwardly and unambiguously determine the main characteristics of chiral magnetic distributions: i.e., its chiral nature, the quantitative winding sense (clockwise or counterclockwise), and its type, i.e., Néel [cycloidal] or Bloch [helical]. This method is model independent, does not require a priori knowledge of the magnetic parameters, and can be applied to any system with magnetic domains ranging from a few nanometers (wavelength limited) to several microns. By using prototypical multilayers with tailored magnetic chiralities driven by spin-orbit-related effects at Co |Pt interfaces, we illustrate the strength of this method.

Optimization of parameters affecting LSM performance as diffractors of x rays: Final technical report, 13 May 1986-31 October 1987

International Nuclear Information System (INIS)

Knight, L.V.

1987-10-01

Our efforts during this contract period were directed toward a deeper understanding of several important issues related to multilayer x-ray mirrors. The results have important practical applications. The topics studied included: Basic Stress-Strain-Curvature Theory for Thin Silicon Wafers with Oxide and Nitride Films; this theory and accompanying experimental verification could form the basis for development of a code that will be able to predict the final figure of a silicon substrate that has been etched and treated with oxide or nitride films; this code will allow the design and fabrication of sophisticated curved multilayers; we have applied our theoretical understanding of multilayers to the design of multilayer x-ray optics; Multilayer X-ray Data Analysis Codes; these codes allow the massaging and display of x-ray multilayer characterization data in a wide variety of graphical ways; the code is user friendly; simulation of multilayers behavior in a high x-ray flux environment; this code combines an x-ray input code (BUCKL) with a 1-D hydrodynamic code (Chart-D) and our own iterative multilayer design code to determine the reflectivity of multilayers as a function of time when the multilayer is in a region of high x-ray flux; BUCKL and Chart-D are from Sandia Labs.; and we have completed the first series of experimental measurements of multilayer reflectivity while subjected to a pulse of intense x-ray flux; the experiments were done with the Phoenix laser at LLNL; the results are included. 48 refs., 29 figs

Center for X-Ray Optics, 1992

International Nuclear Information System (INIS)

1993-08-01

This report discusses the following topics: Center for X-Ray Optics; Soft X-Ray Imaging wit Zone Plate Lenses; Biological X-Ray microscopy; Extreme Ultraviolet Lithography for Nanoelectronic Pattern Transfer; Multilayer Reflective Optics; EUV/Soft X-ray Reflectometer; Photoemission Microscopy with Reflective Optics; Spectroscopy with Soft X-Rays; Hard X-Ray Microprobe; Coronary Angiography; and Atomic Scattering Factors

Streaked spectrometry using multilayer x-ray-interference mirrors to investigate energy transport in laser-plasma applications

International Nuclear Information System (INIS)

Stradling, G.L.; Barbee, T.W. Jr.; Henke, B.L.; Campbell, E.M.; Mead, W.C.

1981-08-01

Transport of energy in laser-produced plasmas is scrutinized by devising spectrally and temporally identifiable characteristics in the x-ray emission history which identify the heat-front position at various times in the heating process. Measurements of the relative turn-on times of these characteristics show the rate of energy transport between various points. These measurements can in turn constrain models of energy transport phenomena. We are time-resolving spectrally distinguishable subkilovolt x-ray emissions from different layers of a disk target to examine the transport rate of energy into the target. A similar technique is used to measure the lateral expansion rate of the plasma spot. A soft x-ray streak camera with 15-psec temporal resolution is used to make the temporal measurements. Spectral discrimination of the incident signal is provided by multilayer x-ray interference mirrors

Periodicity Analysis of X-ray Light Curves of SS 433

Science.gov (United States)

Wang, Jun-yi; Lu, Xiang-long; Zhao, Qiu-wen; Dong, Dian-qiao; Lao, Bao-qiang; Lu, Yang; Wei, Yan-heng; Wu, Xiao-cong; An, Tao

2017-01-01

SS 433 is sofar the unique X-ray binary that has the simultaneously detected orbital period, super-orbital period, and nutation period, as well as a bidirectional spiral jet. The study on its X-ray light variability is helpful for understanding the dynamic process of the system, and the correlations between the different wavebands. In this paper, two time-series analysis techniques, i.e., the Lomb-Scargle periodogram and weighted wavelet Z-transform, are employed to search for the periods in the Swift/BAT (Burst Alert Telescope) (15-50 keV) and RXTE/ASM (Rose X-ray Timing Explorer/All Sky Monitor) (1.5-3, 3- 4, and 5-12 keV) light curves of SS 433, and the Monte Carlo simulation is performed for the obtained periodical components. For the 15-50 keV energy band, five significant periodical components are detected, which are P1(∼6.29 d), P2 (∼6.54 d), P3 (∼13.08 d), P4 (∼81.50 d), and P5 (∼162.30 d). For the 3-5 and 5-12 keV energy bands, the periodical components P3 (∼13 d) and P5 (∼162 d) are detected in both energy bands. However, for the 1.5-3 keV energy band, no significant periodic signal is detected. P5 is the strongest periodic signal in the power spectrum for all the energy bands of 3-5, 5-12, and 15-50 keV, and it is consistent with the previous result obtained from the study of optical light curves. Furthermore, in combination with the radio spiral jet of SS 433, it is suggested that the X-ray and optical variability of P5 (∼162 d) is probably related to the precession of its relativistic jet. The high correlation between the X-ray and optical light curves may also imply that the X-ray and optical radiations are of the same physical origin. P3 shows a good agreement with the orbital period (∼13.07 d) obtained by the previous study, and P2 and P4 are respectively the high-frequency harmonics of P3 and P5. P1 is detected only in the power spectrum of the 15-50 keV energy band, and it is consistent with the nutation period of the system. As

Accounting for nanometer-thick adventitious carbon contamination in X-ray absorption spectra of carbon-based materials.

Science.gov (United States)

Mangolini, Filippo; McClimon, J Brandon; Rose, Franck; Carpick, Robert W

2014-12-16

Near-edge X-ray absorption fine structure (NEXAFS) spectroscopy is a powerful technique for characterizing the composition and bonding state of nanoscale materials and the top few nanometers of bulk and thin film specimens. When coupled with imaging methods like photoemission electron microscopy, it enables chemical imaging of materials with nanometer-scale lateral spatial resolution. However, analysis of NEXAFS spectra is often performed under the assumption of structural and compositional homogeneity within the nanometer-scale depth probed by this technique. This assumption can introduce large errors when analyzing the vast majority of solid surfaces due to the presence of complex surface and near-surface structures such as oxides and contamination layers. An analytical methodology is presented for removing the contribution of these nanoscale overlayers from NEXAFS spectra of two-layered systems to provide a corrected photoabsorption spectrum of the substrate. This method relies on the subtraction of the NEXAFS spectrum of the overlayer adsorbed on a reference surface from the spectrum of the two-layer system under investigation, where the thickness of the overlayer is independently determined by X-ray photoelectron spectroscopy (XPS). This approach is applied to NEXAFS data acquired for one of the most challenging cases: air-exposed hard carbon-based materials with adventitious carbon contamination from ambient exposure. The contribution of the adventitious carbon was removed from the as-acquired spectra of ultrananocrystalline diamond (UNCD) and hydrogenated amorphous carbon (a-C:H) to determine the intrinsic photoabsorption NEXAFS spectra of these materials. The method alters the calculated fraction of sp(2)-hybridized carbon from 5 to 20% and reveals that the adventitious contamination can be described as a layer containing carbon and oxygen ([O]/[C] = 0.11 ± 0.02) with a thickness of 0.6 ± 0.2 nm and a fraction of sp(2)-bonded carbon of 0.19 ± 0.03. This

Interfacial electronic charge transfer and density of states in short period Cu/Cr multilayers; TOPICAL

International Nuclear Information System (INIS)

Barbee, T W; Bello, A F; Klepeis, J E; Van Buuren, T

1999-01-01

Nanometer period metallic multilayers are ideal structures to investigate electronic phenomena at interfaces between metal films since interfacial atoms comprise a large atomic fraction of the samples. The Cu/Cr binary pair is especially suited to study the interfaces in metals since these elements are mutually insoluble, thus eliminating mixing effects and compound formation and the lattice mismatch is very small. This allows the fabrication of high structural quality Cu/Cr multilayers that have a structure which can be approximated in calculations based on idealized atomic arrangements. The electronic structure of the Cu and the Cr layers in several samples of thin Cu/Cr multilayers were studied using x-ray absorption spectroscopy (XAS). Total electron yield was measured and used to study the white lines at the Cu L(sub 2) and L(sub 3) absorption edges. The white lines at the Cu absorption edges are strongly related to the unoccupied d-orbitals and are used to calculate the amount of charge transfer between the Cr and Cu atoms in interfaces. Analysis of the Cu white lines show a charge transfer of 0.026 electrons/interfacial Cu atom to the interfacial Cr atoms. In the Cu XAS spectra we also observe a van Hove singularity between the L(sub 2) and L(sub 3) absorption edges as expected from the structural analysis. The absorption spectra are compared to partial density of states obtained from a full-potential linear muffin-tin orbital calculation. The calculations support the presence of charge transfer and indicate that it is localized to the first two interfacial layers in both Cu and Cr

Maskless X-Ray Writing of Electrical Devices on a Superconducting Oxide with Nanometer Resolution and Online Process Monitoring.

Science.gov (United States)

Mino, Lorenzo; Bonino, Valentina; Agostino, Angelo; Prestipino, Carmelo; Borfecchia, Elisa; Lamberti, Carlo; Operti, Lorenza; Fretto, Matteo; De Leo, Natascia; Truccato, Marco

2017-08-22

X-ray nanofabrication has so far been usually limited to mask methods involving photoresist impression and subsequent etching. Herein we show that an innovative maskless X-ray nanopatterning approach allows writing electrical devices with nanometer feature size. In particular we fabricated a Josephson device on a Bi 2 Sr 2 CaCu 2 O 8+δ (Bi-2212) superconducting oxide micro-crystal by drawing two single lines of only 50 nm in width using a 17.4 keV synchrotron nano-beam. A precise control of the fabrication process was achieved by monitoring in situ the variations of the device electrical resistance during X-ray irradiation, thus finely tuning the irradiation time to drive the material into a non-superconducting state only in the irradiated regions, without significantly perturbing the crystal structure. Time-dependent finite element model simulations show that a possible microscopic origin of this effect can be related to the instantaneous temperature increase induced by the intense synchrotron picosecond X-ray pulses. These results prove that a conceptually new patterning method for oxide electrical devices, based on the local change of electrical properties, is actually possible with potential advantages in terms of heat dissipation, chemical contamination, miniaturization and high aspect ratio of the devices.

X-ray diffraction and X-ray standing-wave study of the lead stearate film structure

Energy Technology Data Exchange (ETDEWEB)

Blagov, A. E.; Dyakova, Yu. A.; Kovalchuk, M. V.; Kohn, V. G.; Marchenkova, M. A.; Pisarevskiy, Yu. V.; Prosekov, P. A., E-mail: prosekov@crys.ras.ru [Russian Academy of Sciences, Shubnikov Institute of Crystallography (Russian Federation)

2016-05-15

A new approach to the study of the structural quality of crystals is proposed. It is based on the use of X-ray standing-wave method without measuring secondary processes and considers the multiwave interaction of diffraction reflections corresponding to different harmonics of the same crystallographic reflection. A theory of multiwave X-ray diffraction is developed to calculate the rocking curves in the X-ray diffraction scheme under consideration for a long-period quasi-one-dimensional crystal. This phase-sensitive method is used to study the structure of a multilayer lead stearate film on a silicon substrate. Some specific structural features are revealed for the surface layer of the thin film, which are most likely due to the tilt of the upper layer molecules with respect to the external normal to the film surface.

Imaging Nanometer Phase Coexistence at Defects During the Insulator-Metal Phase Transformation in VO2 Thin Films by Resonant Soft X-ray Holography.

Science.gov (United States)

Vidas, Luciana; Günther, Christian M; Miller, Timothy A; Pfau, Bastian; Perez-Salinas, Daniel; Martínez, Elías; Schneider, Michael; Gührs, Erik; Gargiani, Pierluigi; Valvidares, Manuel; Marvel, Robert E; Hallman, Kent A; Haglund, Richard F; Eisebitt, Stefan; Wall, Simon

2018-05-18

We use resonant soft X-ray holography to image the insulator-metal phase transition in vanadium dioxide with element and polarization specificity and nanometer spatial resolution. We observe that nanoscale inhomogeneity in the film results in spatial-dependent transition pathways between the insulating and metallic states. Additional nanoscale phases form in the vicinity of defects which are not apparent in the initial or final states of the system, which would be missed in area-integrated X-ray absorption measurements. These intermediate phases are vital to understand the phase transition in VO 2 , and our results demonstrate how resonant imaging can be used to understand the electronic properties of phase-separated correlated materials obtained by X-ray absorption.

X-ray photographs of a solar active region with a multilayer telescope at normal incidence

Science.gov (United States)

Underwood, J. H.; Bruner, M. E.; Haisch, B. M.; Brown, W. A.; Acton, L. W.

1987-01-01

An astronomical photograph was obtained with a multilayer X-ray telescope. A 4-cm tungsten-carbon multilayer mirror was flown as part of an experimental solar rocket payload, and successful images were taken of the sun at normal incidence at a wavelength of 44 A. Coronal Si XII emission from an active region was recorded on film; as expected, the structure is very similar to that observed at O VIII wavelengths by the Solar Maximum Mission flat-crystal spectrometer at the same time. The small, simple optical system used in this experiment appears to have achieved a resolution of 5 to 10 arcsec.

Mechanical design of multiple zone plates precision alignment apparatus for hard X-ray focusing in twenty-nanometer scale

Energy Technology Data Exchange (ETDEWEB)

Shu, Deming; Liu, Jie; Gleber, Sophie C.; Vila-Comamala, Joan; Lai, Barry; Maser, Jorg M.; Roehrig, Christian; Wojcik, Michael J.; Vogt, Franz Stefan

2017-04-04

An enhanced mechanical design of multiple zone plates precision alignment apparatus for hard x-ray focusing in a twenty-nanometer scale is provided. The precision alignment apparatus includes a zone plate alignment base frame; a plurality of zone plates; and a plurality of zone plate holders, each said zone plate holder for mounting and aligning a respective zone plate for hard x-ray focusing. At least one respective positioning stage drives and positions each respective zone plate holder. Each respective positioning stage is mounted on the zone plate alignment base frame. A respective linkage component connects each respective positioning stage and the respective zone plate holder. The zone plate alignment base frame, each zone plate holder and each linkage component is formed of a selected material for providing thermal expansion stability and positioning stability for the precision alignment apparatus.

Multi-layer x-ray screens

International Nuclear Information System (INIS)

Rabatin, J.G.

1984-01-01

Rare earth oxyhalide phosphors activated with thulium ion are employed in X-ray intensifying screens having modified ultraviolet emission characteristics which reduce crossover effects without significant reduction in film speed and further increases screen brightness. Relatively low concentration levels of the thulium activator ion have been found to shift the ultraviolet emission of said phosphor when excited by X-rays to lower wavelengths in both the ultraviolet and near-ultraviolet spectral regions

Optimization of a multilayer Laue lens system for a hard x-ray nanoprobe

International Nuclear Information System (INIS)

Jiang, Hui; Wang, Hua; Mao, Chengwen; Li, Aiguo; He, Yan; Dong, Zhaohui; Zheng, Yi

2014-01-01

Detailed designs of a multilayer Laue lens system for a hard x-ray nanoprobe, including flat and wedged types, are presented, to realize nanoscale point focus and high diffraction efficiency simultaneously. The difficulty of movement and alignment for lens, aperture and sample are considered in the optimization process. Considering the practical requirements of future experiments, the features of the beamline and the structural imperfections, the working energy range, the beam vibration and structural errors are estimated and discussed. (paper)

Total reflection X-ray fluorescence analysis with synchrotron radiation monochromatized by multilayer structures

International Nuclear Information System (INIS)

Rieder, R.; Wobrauschek, P.; Ladisich, W.; Streli, C.; Aiginger, H.; Garbe, S.; Gaul, G.; Knoechel, A.; Lechtenberg, F.

1995-01-01

To achieve lowest detection limits in total reflection X-ray fluorescence analysis (TXRF) synchrotron radiation has been monochromatized by a multilayer structure to obtain a relative broad energy band compared to Bragg single crystals for an efficient excitation. The energy has been set to 14 keV, 17.5 keV, 31 keV and about 55 keV. Detection limits of 20 fg and 150 fg have been achieved for Sr and Cd, respectively. ((orig.))

Focusing X-rays to a 1-μm spot using elastically bent, graded multilayer coated mirrors

International Nuclear Information System (INIS)

Underwood, J.H.; Thompson, A.C.; Kortright, J.B.

1997-01-01

In the x-ray fluorescent microprobe at beamline 10.3.1, the ALS bending magnet source is demagnified by a factor of several hundred using a pair of mirrors arranged in the Kirkpatrick-Baez (K-B) configuration. These are coated with multilayers to increase reflectivity and limit the pass band of the x-rays striking the sample. The x-rays excite characteristic fluorescent x-rays of elements in the sample, which are analyzed by an energy dispersive Si-Li detector, for a sensitive assay of the elemental content. By scanning the focal spot the spatial distribution of the elements is determined; the spatial resolution depends on the size of this spot. When spherical mirrors are used, the spatial resolution is limited by aberrations to 5 or 10 μm. This has been improved to 1 μm through the use of an elliptical mirror formed by elastically bending a plane mirror of uniform width and thickness with the optimum combination of end couples

Focusing X-rays to a 1-{mu}m spot using elastically bent, graded multilayer coated mirrors

Energy Technology Data Exchange (ETDEWEB)

Underwood, J.H.; Thompson, A.C.; Kortright, J.B. [Ernest Orlando Lawrence Berkeley National Lab., CA (United States)] [and others

1997-04-01

In the x-ray fluorescent microprobe at beamline 10.3.1, the ALS bending magnet source is demagnified by a factor of several hundred using a pair of mirrors arranged in the Kirkpatrick-Baez (K-B) configuration. These are coated with multilayers to increase reflectivity and limit the pass band of the x-rays striking the sample. The x-rays excite characteristic fluorescent x-rays of elements in the sample, which are analyzed by an energy dispersive Si-Li detector, for a sensitive assay of the elemental content. By scanning the focal spot the spatial distribution of the elements is determined; the spatial resolution depends on the size of this spot. When spherical mirrors are used, the spatial resolution is limited by aberrations to 5 or 10 {mu}m. This has been improved to 1 {mu}m through the use of an elliptical mirror formed by elastically bending a plane mirror of uniform width and thickness with the optimum combination of end couples.

Investigation of multilayer X-ray optics for 6 keV to 20 keV energy range

Czech Academy of Sciences Publication Activity Database

Oberta, Peter; Platonov, Y.; Flechsig, U.

2012-01-01

Roč. 19, č. 5 (2012), s. 675-681 ISSN 0909-0495 Institutional research plan: CEZ:AV0Z10100522 Keywords : X-ray optics * multilayer * energy resolution Subject RIV: BH - Optics, Masers, Lasers Impact factor: 2.186, year: 2012 http://journals.iucr.org/s/issues/2012/05/00/issconts.html

Residual stress analysis of a multi-layer thin film structure by destructive (curvature) and non-destructive (x-ray) methods

International Nuclear Information System (INIS)

Chen, P.C.; Oshida, Y.

1989-01-01

Multi-layer thin film which has structure of Cu/Cr/K/Cr/Cu prepared by sputtering process was analyzed for interfacial stresses for as-deposited conditions. This structure was also annealed at 150 degrees C, and 350 degrees C for around 15 min. in a vacuum and cooled slowly down for stress analyses. Equations for residual stress estimations for homogeneous material system using layer removal technique (stress relief) is now applied for inhomogeneous system (multi-layer structure). The results are compared with the data obtained from x-ray diffraction technique by using sin 2 Ψ - 2 θ method, for Cu layer. From the present analyses, the data obtained using layer removal seem to be qualitatively consistent with but not quantitatively in agreement with x-ray method

Investigation of the X-ray diffraction properties of a synthetic multilayer. 1998 summer research program for high school juniors at the University of Rochester's Laboratory for Laser Energetics. Student research reports

International Nuclear Information System (INIS)

Ostromogolsky, P.

1999-03-01

In this investigation spectroscopy was used to evaluate the x-ray diffraction properties of a synthetic WB 4 C multilayer for possible use in the OMEGA gated monochromatic x-ray imager (GMXI). The multilayer was placed on a diffractometer, and measurements were made with a lithium-drifted silicon [Si(Li)] x-ray detector, connected to a multi-channel analyzer. The properties of the multilayer were inferred from gaussian fits to the measured diffraction curves. A multilayer with a 2d spacing of 25 angstrom was tested at energies from 1.7 to 4.5 keV

Raman and X-ray diffraction study of (Ba,Sr)TiO3/(Bi,Nd)FeO3 multilayer heterostructures

International Nuclear Information System (INIS)

Anokhin, A.S.; Bunina, O.A.; Golovko, Yu I.; Mukhortov, V.M.; Yuzyuk, Yu I.; Simon, P.

2013-01-01

We report synthesis, X-ray diffraction (XRD) and Raman scattering characterisation of epitaxial heterostructures containing alternating (Bi 0.98 Nd 0.02 )FeO 3 (BNFO) and (Ba 0.8 Sr 0.2 TiO 3 ) (BST) layers deposited on (100) MgO substrates. A significant shift of the BST soft mode and partial depolarisation in the Raman spectra of multilayer heterostructures caused by epitaxial strains were observed. Satellite peaks typical for superlattices were observed in the XRD patterns of multilayer heterostructures with layer thicknesses below 30 nm. Raman spectra of the BNFO/BST superlattice with a modulation period of 10 nm revealed hardening of the soft mode and a dominating symmetric-stretching mode at 705 cm −1 due to distortion in FeO 6 octahedra enforced by the epitaxial strain in the superlattice. - Highlights: • BNFO and BST multilayers and superlattices on (100) MgO. • Raman spectra of superlattices exhibit features not observed in bulk BFO. • Satellites in XRD patterns when layer thickness below 30 nm

Enhanced brightness x-ray lasers

International Nuclear Information System (INIS)

Wan, A.S.; Cauble, R.C.; Da Silva, L.B.; Moreno, J.C.; Nilsen, J.

1994-09-01

We are developing short-pulsed, enhanced-brightness, and coherent x-ray lasers (XRLs) for applications in areas such as plasma imaging. In a traveling wave pump setup the optical laser creating the XRL plasma sweeps along the lasant axis at the same speed as the x-rays. This technique becomes increasingly important as the target length increases and the gain duration shortens. An order of magnitude increase in output energy was measured with vs without traveling wave pump. Using multiple pulse techniques and multilayer mirrors to inject the output of one pulse back into the plasma formed by a later pulse we have begun to develop the x-ray analog of a multi-pass amplifler. The use of multiple pulses separated by as much as 1.6 ns reduces multilayer mirror damage. This injection technique is demonstrated by imaging the near-field emission profiles of the XRL. The addition of multilayer beamsplitter will allow us to effectively produce a soft XRL cavity

Mechanical and tribological properties of a-C/a-C:Ti multilayer films with various bilayer periods

Energy Technology Data Exchange (ETDEWEB)

Bai, W.Q.; Cai, J.B.; Wang, X.L., E-mail: wangxl@zju.edu.cn; Wang, D.H.; Gu, C.D.; Tu, J.P., E-mail: tujp@zju.edu.cn

2014-05-02

Thick a-C/a-C:Ti multilayer films with bilayer periods of 12–70 nm were deposited on Ti6Al4V alloy substrate by means of closed field unbalance magnetron sputtering. The morphology and microstructure of the multilayer films were investigated by scanning electron microscopy, high resolution transmission electron microscopy and X-ray photoelectron spectroscopy. Nanocrystalline TiC was distributed in the a-C:Ti layer and at the interface between the two adjacent layers. The mechanical and tribological properties were evaluated by Rockwell and scratch tests, a nanoindentor and a ball-on-disk tribometer. The multilayer film with a bilayer period of 12 nm showed the highest adhesion strength, hardness (26 GPa) and elastic modulus (232 GPa); it also had the lowest average coefficient of friction (0.09) and a wear rate of 8.06 × 10{sup −17} m{sup 3} N{sup −1} m{sup −1}. - Highlights: • a-C/a-C:Ti multilayers with various bilayer periods were prepared. • Nanocrystalline TiCs were confirmed in the a-C:Ti layer and at the interface. • These multilayers show fine ability to comply with substrate deformation. • The multilayer with a bilayer period of 12 nm exhibits the best properties.

Polyphenylsilole multilayers--an insight from X-ray electron spectroscopy and density functional theory.

Science.gov (United States)

Diller, Katharina; Ma, Yong; Luo, Yi; Allegretti, Francesco; Liu, Jianzhao; Tang, Ben Zhong; Lin, Nian; Barth, Johannes V; Klappenberger, Florian

2015-12-14

We present a combined investigation by means of X-ray photoelectron spectroscopy (XPS) and near-edge X-ray absorption fine-structure (NEXAFS) spectroscopy of condensed multilayers of two polyphenylsiloles, namely hexaphenylsilole (HPS) and tetraphenylsilole (TPS). Both compounds exhibit very similar spectroscopic signatures, whose interpretation is aided by density functional theory (DFT) calculations. High-resolution XPS spectra of the Si 2p and C 1s core levels of these multilayers indicate a positively charged silicon ion flanked by two negatively charged adjacent carbon atoms in the silole core of both molecules. This result is corroborated quantitatively by DFT calculations on isolated HPS (TPS) molecules, which show a natural bond orbital partial charge of +1.67 e (+1.58 e) on the silicon and -0.34 e (-0.58 e) on the two neighbouring carbon atoms in the silole ring. These charges are conserved in direct contact with a Cu(111) substrate for films of submonolayer coverage, as evidenced by the Si 2p XPS data. The C K-edge NEXAFS spectra of HPS and TPS multilayers exhibit distinct and differing features. Their main characteristics reappear in the simulated spectra and are assigned to the different inequivalent carbon species in the molecule. The angle-dependent measurements hardly reveal any dichroism, i.e., the molecular π-systems are not uniformly oriented parallel or perpendicular with respect to the surface. Changes in the growth conditions of TPS, i.e., a reduction of the substrate temperature from 240 K to 80 K during deposition, lead to a broadening of both XPS and NEXAFS signatures, as well as an upward shift of the Si 2p and C 1s binding energies, indicative of a less ordered growth mode at low temperature.

AN EXTENDED AND MORE SENSITIVE SEARCH FOR PERIODICITIES IN ROSSI X-RAY TIMING EXPLORER/ALL-SKY MONITOR X-RAY LIGHT CURVES

International Nuclear Information System (INIS)

Levine, Alan M.; Bradt, Hale V.; Chakrabarty, Deepto; Corbet, Robin H. D.; Harris, Robert J.

2011-01-01

We present the results of a systematic search in ∼14 years of Rossi X-ray Timing Explorer All-Sky Monitor (ASM) data for evidence of periodicities. Two variations of the commonly used Fourier analysis search method have been employed to significantly improve upon the sensitivity achieved by Wen et al. in 2006, who also searched for periodicities in ASM data. In addition, the present search is comprehensive in terms of sources studied and frequency range covered, and has yielded the detection of the signatures of the orbital periods of eight low-mass X-ray binary systems and of ten high-mass X-ray binaries not listed in the tables of Wen et al. Orbital periods, epochs, signal amplitudes, modulation fractions, and folded light curves are given for each of these systems. Seven of the orbital periods are the most precise reported to date. In the course of this work, the 18.545 day orbital period of IGR J18483-0311 was co-discovered, and the first detections in X-rays were made of the ∼3.9 day orbital period of LMC X-1 and the ∼3.79 hr orbital period of 4U 1636-536. The results inform future searches for orbital and other periodicities in X-ray binaries.

Nano-structuring of multi-layer material by single x-ray vortex pulse with femtosecond duration

Science.gov (United States)

Kohmura, Yoshiki; Zhakhovsky, Vasily; Takei, Dai; Suzuki, Yoshio; Takeuchi, Akihisa; Inoue, Ichiro; Inubushi, Yuichi; Inogamov, Nail; Ishikawa, Tetsuya; Yabashi, Makina

2018-03-01

A narrow zero-intensity spot arising from an x-ray vortex has huge potential for future applications such as nanoscopy and nanofabrication. We here present an X-ray Free Electron Laser (XFEL) experiment with a focused vortex wavefront which generated high aspect ratio nanoneedles on a Cr/Au multi-layer (ML) specimen. A sharp needle with a typical width and height of 310 and 600 nm was formed with a high occurrence rate at the center of a 7.71 keV x-ray vortex on this ML specimen, respectively. The observed width exceeds the diffraction limit, and the smallest structures ever reported using an intense-XFEL ablation were fabricated. We found that the elemental composition of the nanoneedles shows a significant difference from that of the unaffected area of Cr/Au ML. All these results are well explained by the molecular dynamics simulations, leading to the elucidation of the needle formation mechanism on an ultra-fast timescale.

Monochromatic x-rays for low-dose digital mammography: preliminary results.

Science.gov (United States)

Yoon, Kwon-Ha; Kwon, Young Man; Choi, Byoung-Jung; Son, Hyun Hwa; Ryu, Cheol Woo; Chon, Kwon Su; Park, Seong Hoon; Juhng, Sun Kwan

2012-12-01

The feasibility of using monochromatic x-ray imaging generated from an x-ray tube and a multilayer reflector for digital mammography with a low radiation dose was examined. A multilayer mirror was designed to select the x-ray peak with an energy of 21.5 keV generated from an x-ray tube with a tungsten target and was fabricated by the ion-beam sputtering deposition system. Monochromatic x-ray images were obtained from an experimental digital mammography setup with a scanning stage. The performance of the system was evaluated using a breast phantom, a spectrometer, and a radiation dosimeter. We measured the contrast-to-noise ratio and performed the 10% modulation function test to determine image quality and resolution. The monochromatic beam from the multilayer reflector had a full-width-at-half-maximum of 0.9 keV at 21.5 keV, and the reflectivity was 0.70, which was 90% of the designed value. The polychromatic and monochromatic x-rays showed radiation doses of 0.497 and 0.0415 mGy, respectively. The monochromatic x-ray image shows fibers, calcifications, and masses more clearly than the polychromatic x-ray images do. The image contrast of the monochromatic x-rays was 1.85 times higher than that of the polychromatic x-rays. The experimental mammography setup had a spatial resolution of 7 lp/mm with both x-rays. Monochromatic x-rays generated using a multilayer mirror may be a useful diagnostic tool for breast examination by providing high contrast imaging with a low radiation dose.

Quasi-kinoform type multilayer zone plate with high diffraction efficiency for high-energy X-rays

International Nuclear Information System (INIS)

Tamura, S; Yasumoto, M; Kamijo, N; Uesugi, K; Takeuchi, A; Terada, Y; Suzuki, Y

2009-01-01

Fresnel zone plate (FZP) with high diffraction efficiency leads to high performance X-ray microscopy with the reduction of the radiation damage to biological specimens. In order to attain high diffraction efficiency in high energy X-ray region, we have developed multilevel-type (6-step) multilayer FZPs with the diameter of 70 micron. The efficiencies of two FZPs were evaluated at the BL20XU beamline of SPring-8. For one FZP, the peak efficiency for the 1st-order diffraction of 51% has been obtained at 70 keV. The efficiencies higher than 40% have been achieved in the wide energy range of 70-90 keV. That for the 2nd-order diffraction of 46% has been obtained at 37.5 keV.

Fabrication, performance, and figure metrology of epoxy-replicated aluminum foils for hard x-ray focusing multilayer-coated segmented conical optics

DEFF Research Database (Denmark)

Jimenez-Garate, M.A.; Craig, W.W.; Hailey, C.J.

2000-01-01

We fabricated x-ray mirrors for hard x-ray (greater than or equal to 10 keV) telescopes using multilayer coatings and an improved epoxy-replicated aluminum foil (ERAF) nonvacuum technology. The ERAF optics have similar to1 arcmin axial figure half-power diameter (HPD) and passed environmental...... telescope HPD, we designed a figure metrology system and a new mounting technique. We describe a cylindrical metrology system built for fast axial and roundness figure measurement of hard x-ray conical optics. These developments lower cost and improve the optics performance of the HEFT (high-energy focusing...

The development for small scale soft X-ray spectrometer

International Nuclear Information System (INIS)

Sun Kexu; Jiang Shaoen; Yi Rongqing; Cui Yanli

2004-12-01

For the development of small-scale soft X-ray spectrometer, first, some small-scale soft X-ray detection elements are developed, it is included GaAs irradiated with neutron, GaAs irradiated with proton, multi-layer mirror, plane mirror and small scale X-ray diode et al. Soft X-ray spectrometers built of multi-layer mirror-GaAs (with neutron irradiation), and plane mirror-small-scale XRD, and plane mirror-GaAs (with proton irradiation) are prepared. These spectrometers are examined in Shen Guang-II laser facility, and some external estimation are given. (authors)

Structural evolution of Ti/TiC multilayers

International Nuclear Information System (INIS)

Dahan, I.; Frage, N.; Dariel, M.P.

2004-01-01

Hard coatings based on metal/ceramic multilayers with periods in the nanometer range have been shown to possess some potential for improved tribological and mechanical properties. The present work is concerned with the structural evolution of (Ti/TiC) multilayers. Two kinds of multilayers consisting of 30 equithick (40 nm)TiC layers and 20 and 60 nm thick Ti layers, respectively, were sputter deposited on Mo substrates. The structural and the compositional evolution of these multilayers were examined by x-ray diffraction, transition electron microscopy (TEM), high-resolution TEM, Auger electron microscopy spectroscopy and differential thermal analysis (DTA), in the as-deposited state and after various heat treatments up to 500 deg. C. Initially, the Ti layers had a crystalline columnar grain structure displaying a (002) texture. The TiC layers displayed weak crystallinity with a pronounced (111) texture. In the course of the heat treatments, carbon diffused from the carbide layer into the adjacent Ti layers transforming the latter into off-stoichiometric TiC x with x≅0.5 and simultaneously depleting the carbon content of the initial carbide layer. The formed TiC x layers maintained the textural relationship with the neighboring TiC layers, consistent with a transformation that involved only a ABAB to ABC stacking change of the Ti sublattice. Increased mobility of the Ti atoms in carbon-depleted original TiC layers led to their full or partial recrystallization. The thermal effects associated both with the transformation of Ti layers into TiC, due to the influx of carbon atoms, and with the recrystallization of the original TiC layers were clearly revealed by the DTA measurements

Hard X-ray mirrors for Nuclear Security

Energy Technology Data Exchange (ETDEWEB)

Descalle, M. A. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Brejnholt, N. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Hill, R. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Decker, T. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Alameda, J. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Soufli, R. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Pivovaroff, M. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Pardini, T. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)

2016-01-07

Research performed under this LDRD aimed to demonstrate the ability to detect and measure hard X-ray emissions using multilayer X-ray reflective optics above 400 keV, to enable the development of inexpensive and high-accuracy mirror substrates, and to investigate applications of hard X-ray mirrors of interest to the nuclear security community. Experiments conducted at the European Synchrotron Radiation Facility demonstrated hard X-ray mirror reflectivity up to 650 keV for the first time. Hard X-ray optics substrates must have surface roughness under 3 to 4 Angstrom rms, and three materials were evaluated as potential substrates: polycarbonates, thin Schott glass and a new type of flexible glass called Willow Glass®. Chemical smoothing and thermal heating of the surface of polycarbonate samples, which are inexpensive but have poor intrinsic surface characteristics, did not yield acceptable surface roughness. D263 Schott glass was used for the focusing optics of the NASA NuSTAR telescope. The required specialized hardware and process were costly and motivated experiments with a modified non-contact slumping technique. The surface roughness of the glass was preserved and the process yielded cylindrical shells with good net shape pointing to the potential advantage of this technique. Finally, measured surface roughness of 200 and 130 μm thick Willow Glass sheets was between 2 and 2.5 A rms. Additional results of flexibility tests and multilayer deposition campaigns indicated it is a promising substrate for hard X-ray optics. The detection of U and Pu characteristics X-ray lines and gamma emission lines in a high background environment was identified as an area for which X-ray mirrors could have an impact and where focusing optics could help reduce signal to noise ratio by focusing signal onto a smaller detector. Hence the first one twelvetant of a Wolter I focusing optics for the 90 to 140 keV energy range based on aperiodic multilayer coating was designed. Finally

X1908+075: An X-Ray Binary with a 4.4 Day Period

Science.gov (United States)

Wen, Linqing; Remillard, Ronald A.; Bradt, Hale V.

2000-04-01

X1908+075 is an optically unidentified and highly absorbed X-ray source that appeared in early surveys such as Uhuru, OSO 7, Ariel 5, HEAO-1, and the EXOSAT Galactic Plane Survey. These surveys measured a source intensity in the range 2-12 mcrab at 2-10 keV, and the position was localized to ~0.5d. We use the Rossi X-Ray Timing Explorer (RXTE) All-Sky Monitor (ASM) to confirm our expectation that a particular Einstein/IPC detection (1E 1908.4+0730) provides the correct position for X1908+075. The analysis of the coded mask shadows from the ASM for the position of 1E 1908.4+0730 yields a persistent intensity ~8 mcrab (1.5-12 keV) over a 3 yr interval beginning in 1996 February. Furthermore, we detect a period of 4.400+/-0.001 days with a false-alarm probability less than 10-7. The folded light curve is roughly sinusoidal, with an amplitude that is 26% of the mean flux. The X-ray period may be attributed to the scattering and absorption of X-rays through a stellar wind combined with the orbital motion in a binary system. We suggest that X1908+075 is an X-ray binary with a high-mass companion star.

Direct and inverse problems of studying the properties of multilayer nanostructures based on a two-dimensional model of X-ray reflection and scattering

Science.gov (United States)

Khachaturov, R. V.

2014-06-01

A mathematical model of X-ray reflection and scattering by multilayered nanostructures in the quasi-optical approximation is proposed. X-ray propagation and the electric field distribution inside the multilayered structure are considered with allowance for refraction, which is taken into account via the second derivative with respect to the depth of the structure. This model is used to demonstrate the possibility of solving inverse problems in order to determine the characteristics of irregularities not only over the depth (as in the one-dimensional problem) but also over the length of the structure. An approximate combinatorial method for system decomposition and composition is proposed for solving the inverse problems.

Prospects for supermirrors in hard x-ray spectroscopy

DEFF Research Database (Denmark)

Joensen, Karsten D.; Gorenstein, Paul; Christensen, Finn Erland

1994-01-01

. The measured x-ray reflectivities are well accounted for by the standard dynamical theories of multilayer reflection. Hard x ray applications that could benefit from x-ray supermirror coatings include focusing and imaging instrumentation for astrophysics, collimating and focusing devices for synchrotron...

Highly efficient blazed grating with multilayer coating for tender X-ray energies

NARCIS (Netherlands)

Senf, F.; Bijkerk, Frederik; Eggenstein, F.; Gwalt, G.; Huang, Qiushi; van de Kruijs, Robbert Wilhelmus Elisabeth; Kutz, O.; Lemke, S.; Louis, Eric; Mertin, M.; Packe, I.; Rudolph, I.; Schafers, F.; Siewert, F.; Sokolov, A.; Sturm, Jacobus Marinus; Waberski, C.; Wang, Z.; Wolf, J.; Zeschke, T.; Erko, A.

2016-01-01

For photon energies of 1 – 5 keV, blazed gratings with multilayer coating are ideally suited for the suppression of stray and higher orders light in grating monochromators. We developed and characterized a blazed 2000 lines/mm grating coated with a 20 period Cr/C- multilayer. The multilayer

Soft x-ray lasers

International Nuclear Information System (INIS)

Matthews, D.L.; Rosen, M.D.

1988-01-01

One of the elusive dreams of laser physicists has been the development of an x-ray laser. After 25 years of waiting, the x-ray laser has at last entered the scientific scene, although those now in operation are still laboratory prototypes. They produce soft x rays down to about five nanometers. X-ray lasers retain the usual characteristics of their optical counterparts: a very tight beam, spatial and temporal coherence, and extreme brightness. Present x-ray lasers are nearly 100 times brighter that the next most powerful x-ray source in the world: the electron synchrotron. Although Lawrence Livermore National Laboratory (LLNL) is widely known for its hard-x-ray laser program which has potential applications in the Strategic Defense Initiative, the soft x-ray lasers have no direct military applications. These lasers, and the scientific tools that result from their development, may one day have a place in the design and diagnosis of both laser fusion and hard x-ray lasers. The soft x-ray lasers now in operation at the LLNL have shown great promise but are still in the primitive state. Once x-ray lasers become reliable, efficient, and economical, they will have several important applications. Chief among them might be the creation of holograms of microscopic biological structures too small to be investigated with visible light. 5 figs

Combined evaluation of grazing incidence X-ray fluorescence and X-ray reflectivity data for improved profiling of ultra-shallow depth distributions

Energy Technology Data Exchange (ETDEWEB)

Ingerle, D., E-mail: dingerle@ati.ac.at [Atominstitut, Vienna University of Technology, Stadionallee 2, A-1020 Vienna (Austria); Meirer, F. [Inorganic Chemistry and Catalysis, Debye Institute for Nanomaterials Science, Utrecht University, Universiteitsweg 99, 3584 CG Utrecht (Netherlands); Pepponi, G.; Demenev, E.; Giubertoni, D. [MiNALab, CMM-irst, Fondazione Bruno Kessler, Via Sommarive 18, I-38050 Povo (Italy); Wobrauschek, P.; Streli, C. [Atominstitut, Vienna University of Technology, Stadionallee 2, A-1020 Vienna (Austria)

2014-09-01

The continuous downscaling of the process size for semiconductor devices pushes the junction depths and consequentially the implantation depths to the top few nanometers of the Si substrate. This motivates the need for sensitive methods capable of analyzing dopant distribution, total dose and possible impurities. X-ray techniques utilizing the external reflection of X-rays are very surface sensitive, hence providing a non-destructive tool for process analysis and control. X-ray reflectometry (XRR) is an established technique for the characterization of single- and multi-layered thin film structures with layer thicknesses in the nanometer range. XRR spectra are acquired by varying the incident angle in the grazing incidence regime while measuring the specular reflected X-ray beam. The shape of the resulting angle-dependent curve is correlated to changes of the electron density in the sample, but does not provide direct information on the presence or distribution of chemical elements in the sample. Grazing Incidence XRF (GIXRF) measures the X-ray fluorescence induced by an X-ray beam incident under grazing angles. The resulting angle dependent intensity curves are correlated to the depth distribution and mass density of the elements in the sample. GIXRF provides information on contaminations, total implanted dose and to some extent on the depth of the dopant distribution, but is ambiguous with regard to the exact distribution function. Both techniques use similar measurement procedures and data evaluation strategies, i.e. optimization of a sample model by fitting measured and calculated angle curves. Moreover, the applied sample models can be derived from the same physical properties, like atomic scattering/form factors and elemental concentrations; a simultaneous analysis is therefore a straightforward approach. This combined analysis in turn reduces the uncertainties of the individual techniques, allowing a determination of dose and depth profile of the implanted

Development of the water window imaging x-ray microscope

International Nuclear Information System (INIS)

Hoover, R.B.; Shealy, D.L.; Baker, P.C.; Barbee, T.W. Jr.; Walker, A.B.C. Jr.

1991-01-01

This paper reports on the Water Window Imaging X-ray Microscopy which is currently being developed by a consortium from the Marshall Space Flight Center, the University of Alabama at Birmingham, Baker Consulting, the Lawrence Livermore National Laboratory, and Stanford University. The high quality solar images achieved during the Stanford/MSFC/LLNL Rocket X-ray Spectroheliograph flight conclusively established that excellent imaging could be obtained with doubly reflecting multilayer optical systems. Theoretical studies carried out as part of the MSFC X-ray Microscopy Program, demonstrated that high quality, high resolution multilayer x-ray imaging microscopes could be achieved with spherical optics in the Schwarzschild configuration and with Aspherical optical systems. Advanced Flow Polishing methods have been used to fabricate substrates for multilayer optics. On hemlite grade Sapphire, the authors have achieved microscopy mirror substrates on concave and convex spherical surfaces with 0.5 Angstrom rms surface smoothness, as measured by the Zygo profilometer. In this paper the authors report on the current status of fabrication and testing of the optical and mechanical subsystems for the Water Window Imaging X-ray Microscope

Multilayered samples reconstructed by measuring K{sub α}/K{sub β} or L{sub α}/L{sub β} X-ray intensity ratios by EDXRF

Energy Technology Data Exchange (ETDEWEB)

Cesareo, Roberto, E-mail: cesareo@uniss.it [Istituto per lo Studio dei Materiali Nano Strutturati, CNR-Montelibretti, via Salaria km. 29.5, 00015 Monterotondo (Romania); Assis, Joaquim T. de, E-mail: joaquim.iprj@gmail.com [Universidade do Estado do Rio de Janeiro, Instituto Politécnico, P.O. Box 97282, 28625-570 Nova Friburgo, RJ (Brazil); Roldán, Clodoaldo, E-mail: Clodoaldo.Roldan@uv.es [Instituto de Ciencia de los Materiales, Universidad de Valencia, P.O. Box 22085, E46071 Valencia (Spain); Bustamante, Angel D., E-mail: angelbd1@gmail.com [Universidad Nacional Mayor de San Marcos, Lima (Peru); Brunetti, Antonio, E-mail: brunetti@uniss.it [Dipartimento di Scienze Politiche, Scienza della Comunicazione e Ingegneria dell’ Informazione, Università di Sassari, Sassari (Italy); Schiavon, Nick [Hercules Laboratory and Évora Geophysical Centre, University of Evora (Portugal)

2013-10-01

In this paper a general method based on energy-dispersive X-ray fluorescence (EDXRF) analysis has been tested to assess its possible use as a tool to reconstruct the structure and determine the thickness of two and/or multi-layered materials. The method utilizes the X-ray intensity ratios of K{sub α}/K{sub β} or L{sub α}/L{sub β} peaks (or the ratio of these peaks) for selected elements present in multi-layered objects of various materials (Au alloys, gilded Cu, gilded Ag, gilded Pb, Ag–Au Tumbaga, stone surfaces with protective treatments, Zn or Nickel plating on metals). Results show that, in the case of multi-layered samples, a correct calculation of the peak ratio (K{sub α} /K{sub β} and/or L{sub α}/L{sub β}) of relevant elements from energy-dispersive X-ray fluorescence spectra, can provide important information in assessing the exact location of each layer and for calculating its thickness. The methodological approach shown may have important applications not only in materials science but also when dealing with the conservation and restoration of multi-layered cultural heritage objects where the use of a Non-Destructive techniques to determine slight chemical and thickness variations in the layered structure is often of paramount importance to achieve the best results.

The microstructural evolution of nanometer ruthenium films in Ru/C multilayers with thermal treatments

International Nuclear Information System (INIS)

Nguyen, T.D.; Gronsky, R.; Kortright, J.B.

1991-04-01

The evolution of nanometer Ru films sandwiched between various C layer thickness with thermal treatments was studied by plan-view and cross-sectional Transmission Electron Microscopy. Plan-view observation provides information on the Ru grain size, while cross- sectional studies allow examination of the multilayer morphology. After annealing at 800 degrees C for 30 minutes, the grain size in the 2 and 4 nm Ru layers show little difference from each other, while that in the 1 nm Ru layers depends strongly on the thickness of the C layers in the multilayers. It increases with decreasing C layer thickness. Agglomeration of the Ru layers is observed in 1nm Ru/1nm C multilayers after annealing at 600 degrees C for 30 minutes. The evolution of the microstructures and layered structure stability of the Ru/C system is compared to that of W/C and Ru/B 4 C systems. 10 refs., 2 figs

A compact scanning soft X-ray microscope

International Nuclear Information System (INIS)

Trail, J.A.

1989-01-01

Soft x-ray microscopes operating at wavelengths between 2.3 nm and 4.4 nm are capable of imaging wet biological cells with a resolution many times that of a visible light microscope. Several such soft x-ray microscopes have been constructed. However, with the exception of contact microscopes, all use synchrotrons as the source of soft x-ray radiation and Fresnel zone plates as the focusing optics. These synchrotron based microscopes are very successful but have the disadvantage of limited access. This dissertation reviews the construction and performance of a compact scanning soft x-ray microscope whose size and accessibility is comparable to that of an electron microscope. The microscope uses a high-brightness laser-produced plasma as the soft x-ray source and normal incidence multilayer-coated mirrors in a Schwarzschild configuration as the focusing optics. The microscope operates at a wavelength of 14 nm, has a spatial resolution of 0.5 μm, and has a soft x-ray photon flux through the focus of 10 4 -10 5 s -1 when operated with only 170 mW of average laser power. The complete system, including the laser, fits on a single 4' x 8' optical table. The significant components of the compact microscope are the laser-produced plasma (LPP) source, the multilayer coatings, and the Schwarzschild objective. These components are reviewed, both with regard to their particular use in the current microscope and with regard to extending the microscope performance to higher resolution, higher speed, and operation at shorter wavelengths. Measurements of soft x-ray emission and debris emission from our present LPP source are presented and considerations given for an optimal LPP source. The LPP source was also used as a broadband soft x-ray source for measurement of normal incidence multilayer mirror reflectance in the 10-25 nm spectral region

A high-energy x-ray microscope for inertial confinement fusion

International Nuclear Information System (INIS)

Marshall, F.J.; Bennett, G.R.

1999-01-01

We have developed a microscope capable of imaging x-ray emission from inertial confinement fusion targets in the range of 7 - 9 keV. Imaging is accomplished with a Kirkpatrick-Baez type, four-image microscope coated with a WB 4 C multilayer having a 2d period of 140 Angstrom. This microscope design (a standard used on the University of Rochester close-quote s OMEGA laser system) is capable of 5 μm resolution over a region large enough to image an imploded target (∼400 μm). This design is capable of being extended to ∼40 keV if state-of-the-art, short-spacing, multilayer coatings are used (∼25 Angstrom), and has been configured to obtain 3 μm resolution with the appropriate choice of mirror size. As such, this type of microscope could serve as a platform for multiframe, hard x-ray imaging on the National Ignition Facility. Characterization of the microscope and laboratory measurements of the energy response made with a cw x-ray source will be shown. copyright 1999 American Institute of Physics

Effect of modulation periods on the microstructure and mechanical properties of DLC/TiC multilayer films deposited by filtered cathodic vacuum arc method

International Nuclear Information System (INIS)

Xu, Zhaoying; Sun, H.; Leng, Y.X.; Li, Xueyuan; Yang, Wenmao; Huang, N.

2015-01-01

Highlights: • DLC/TiC multilayer films with different modulation periods at same modulation ratio 1:1 were deposited by FCVA. • The residual stress of DLC/TiC multilayer films decreases with the modulation periods decrease. • The hardness of the multilayer DLC films decreases with modulation periods increasing. - Abstract: The high stress of diamond-like carbon (DLC) film limits its thickness and adhesion on substrate. Multilayer structure is one approach to overcome this disadvantage. In this paper, the DLC/TiC multilayer films with different modulation periods (80 nm, 106 nm or 160 nm) at same modulation ratio of 1:1 were deposited on Si(1 0 0) wafer and Ti-6Al-4V substrate by filtered cathodic vacuum arc (FCVA) technology. X-ray diffraction (XRD), transmission electron microscopy (TEM), nanoindention and wear test were employed to investigate the effect of modulation periods on the microstructure and mechanical properties of the multilayer films. The results showed that the residual stress of the DLC/TiC multilayer films could be effectively reduced and the residual stress decreased with the modulation periods decreasing. The hardness of the DLC/TiC multilayer films increased with modulation periods decreasing. The DLC/TiC multilayer film with modulation period of 106 nm had the best wear resistance due to the good combination of hardness, ductility and low compressive stress

X ray reflection masks: Manufacturing, characterization and first tests

Science.gov (United States)

Rahn, Stephen

1992-09-01

SXPL (Soft X-ray Projection Lithography) multilayer mirrors are characterized, laterally structured and then used as reflection masks in a projecting lithography procedure. Mo/Si-multilayer mirrors with a 2d in the region of 14 nm were characterized by Cu-k(alpha) grazing incidence as well as soft X-ray normal incidence reflectivity measurements. The multilayer mirrors were patterned by reactive ion etching with CF4 using a photoresist as etch mask, thus producing X-ray reflection masks. The masks were tested at the synchrotron radiation laboratory of the electron accelerator ELSA. A double crystal X-ray monochromator was modified so as to allow about 0.5 sq cm of the reflection mask to be illuminated by white synchrotron radiation. The reflected patterns were projected (with an energy of 100 eV) onto a resist and structure sizes down to 8 micrometers were nicely reproduced. Smaller structures were distorted by Fresnel-diffraction. The theoretically calculated diffraction images agree very well with the observed images.

Influence of plasticity mismatch and porosity on mechanical behavior of nanoscale Ag/W multilayers

International Nuclear Information System (INIS)

Wen, S.P.; Zong, R.L.; Zeng, F.; Gao, Y.; Pan, F.

2007-01-01

Ag/W multilayers with periodicity ranging from 15 to 200 nm were deposited by direct current magnetron sputtering. The microstructure, hardness and elastic modulus were investigated by X-ray diffraction, Rutherford backscattering, X-ray fluorescence, scanning electron microscopy and nanoindentation. The results show that multilayers with periodicity less than 50 nm have columnar porous structure, which leads to low modulus and brittle fracture. Multilayers with periodicity larger than 50 nm have continuous laminated structure, and they are relatively ductile. All the multilayers have abnormal low hardness far less than a rule of mixture value, which has been attributed to porous structure and the deformation localization due to the plasticity mismatch between Ag and W

Study of interface correlation in W/C multilayer structure by specular and non-specular grazing incidence X-ray reflectivity measurements

Energy Technology Data Exchange (ETDEWEB)

Biswas, A., E-mail: arupb@barc.gov.in; Bhattacharyya, D.; Sahoo, N. K. [Atomic and Molecular Physics Division, Bhabha Atomic Research Centre, Mumbai 400085 (India); Maidul Haque, S.; Tripathi, S.; De, Rajnarayan [Atomic and Molecular Physics Division, Bhabha Atomic Research Centre, VIZAG Centre, Visakhapatnam 530012 (India); Rai, S. [Indus Synchrotron Utilization Division, Raja Raman Centre for Advanced Technology, Indore 452013 (India)

2015-10-28

W/C/W tri-layer thin film samples have been deposited on c-Si substrates in a home-built Ion Beam Sputtering system at 1.5 × 10{sup −3} Torr Ar working pressure and 10 mA grid current. The tri-layer samples have been deposited at different Ar{sup +} ion energies between 0.6 and 1.2 keV for W layer deposition and the samples have been characterized by specular and non-specular grazing incidence X-ray reflectivity (GIXR) measurements. By analyzing the GIXR spectra, various interface parameters have been obtained for both W-on-C and C-on-W interfaces and optimum Ar{sup +} ion energy for obtaining interfaces with low imperfections has been found. Subsequently, multilayer W/C samples with 5-layer, 7-layer, 9-layer, and 13-layer have been deposited at this optimum Ar{sup +} ion energy. By fitting the specular and diffused GIXR data of the multilayer samples with the parameters of each interface as fitting variables, different interface parameters, viz., interface width, in-plane correlation length, interface roughness, and interface diffusion have been estimated for each interface and their variation across the depth of the multilayers have been obtained. The information would be useful in realizing W/C multilayers for soft X-ray mirror application in the <100 Å wavelength regime. The applicability of the “restart of the growth at the interface” model in the case of these ion beam sputter deposited W/C multilayers has also been investigated in the course of this study.

Uniformity of the soft-x-ray emissions from gold foils irradiated by OMEGA laser beams determined by a two-mirror normal-incidence microscope with multilayer coatings

International Nuclear Information System (INIS)

Seely, John F.; Boehly, Thomas; Pien, Gregory; Bradley, David

1998-01-01

A two-mirror normal-incidence microscope with multilayer coatings was used to image the soft-x-ray emissions from planar foils irradiated by OMEGA laser beams. The bandpass of the multilayer coatings was centered at a wavelength of 48.3 Angstrom (257-eV energy) and was 0.5 Angstrom wide. Five overlapping OMEGA beams, without beam smoothing, were typically incident on the gold foils. The total energy was 1500 J, and the focused intensity was 6x10 13 Wcm -2 . The 5.8x magnified images were recorded by a gated framing camera at various times during the 3-ns laser pulse. A pinhole camera imaged the x-ray emission in the energy range of >2 keV. On a spatial scale of 10 μm, it was found that the soft-x-ray images at 257 eV were quite uniform and featureless. In contrast, the hard-x-ray images in the energy range of >2 kev were highly nonuniform with numerous features of size 150 μm. copyright 1998 Optical Society of America

Ultra-short-period WC/SiC multilayer coatings for x-ray applications

DEFF Research Database (Denmark)

Fernandez-Perea, M.; Pivovaroff, M. J.; Soufli, R.

2013-01-01

developed multilayers with ultra-shortperiods between 1 and 2 nm based on the material system WC/SiC. This material system was selected because it possesses very sharp and stable interfaces. In this article, we show highlights from a series of experiments performed in order to characterize the stress...

Interlayer growth in Mo/B4C multilayered structures upon thermal annealing

International Nuclear Information System (INIS)

Nyabero, S. L.; Kruijs, R. W. E. van de; Yakshin, A. E.; Zoethout, E.; Bosgra, J.; Loch, R. A.; Blanckenhagen, G. von; Bijkerk, F.

2013-01-01

Both multilayer period thickness expansion and compaction were observed in Mo/B 4 C multilayers upon annealing, and the physical causes for this were explored in detail. Using in situ time-dependent grazing incidence X-ray reflectometry, period changes down to picometer-scale were resolved. It was shown that the changes depend on the thickness of the B 4 C layers, annealing temperature, and annealing time. Although strong stress relaxation during annealing was observed, it was excluded as a cause for period expansion. Auger electron spectroscopy and wide angle X-ray diffraction measurements revealed the growth of interlayers, with associated period changes influenced by the supply of B and C atoms to the growing compound interlayers. For multilayers with a Mo thickness of 3 nm, two regimes were recognized, depending on the deposited B 4 C thickness: in multilayers with B 4 C ≤ 1.5 nm, the supply of additional Mo into the already formed MoB x C y interlayer was dominant and led to densification, resulting in period compaction. For multilayers with B 4 C ≥ 2 nm, the B and C enrichment of interlayers formed low density compounds and yielded period expansion.

Magnetic properties of Co/Rh (001) multilayers studied by x-ray magnetic-circular dichroism

Science.gov (United States)

Tomaz, M. A.; Mayo, E.; Lederman, D.; Hallin, E.; Sham, T. K.; O'brien, W. L.; Harp, G. R.

1998-11-01

The layer-averaged magnetic moments of Co and Rh have been measured in sputter deposited Co/Rh (001) multilayer thin films using the x-ray magnetic circular dichroism. The Rh moments were measured at both the L and M absorption edges, where we find that the Rh moment decreases as a function of increasing Rh layer thickness (tRh). The decline of the layer-averaged Rh moment is well described in terms of a simple dilution, implying that the Rh moment is confined to the interfacial region. We find that the Co moment remains largely unaffected, maintaining a bulklike value of 1.7μB in the region preceding the first antiferromagnetic coupling peak where tRh ranges from 0 to 4 Å. We also find, via application of the dichroism sum rules, that the ratio / for Co increases ~10% for this same region. Finally, we contrast the magnetic behavior of the Co/Rh (001) and Fe/Rh (001) multilayer systems.

Fe/Rh (100) multilayer magnetism probed by x-ray magnetic circular dichroism

Science.gov (United States)

Tomaz, M. A.; Ingram, D. C.; Harp, G. R.; Lederman, D.; Mayo, E.; O'brien, W. L.

1997-09-01

We report the layer-averaged magnetic moments of both Fe and Rh in sputtered Fe/Rh (100) multilayer thin films as measured by x-ray magnetic circular dichroism. We observe two distinct regimes in these films. The first is characterized by Rh moments of at least 1μB, Fe moments enhanced as much as 30% above bulk, and a bct crystal structure. The second regime is distinguished by sharp declines of both Fe and Rh moments accompanied by a transition to an fct crystal lattice. The demarcation between the two regions is identified as the layer thickness for which both bct and fct phases first coexist, which we term the critical thickness tcrit. We attribute the change in magnetic behavior to the structural transformation.

Synchrotron X-ray fluorescence analysis in environmental and earth sciences

Directory of Open Access Journals (Sweden)

Adams F.

2010-12-01

Full Text Available Compared to other microscopic analytical tools X-ray microscopy techniques have the advantage that the large penetration depth of X-rays in matter allows one to investigate the interior of an object without destructive sample preparation. In combination with X-ray fluorescence tomography, analytical information from inside of a specimen can be obtained. Different X-ray analytical techniques can be used to produce contrast, X-ray absorption, fluorescence, and diffraction, to yield chemical, elemental, and structural information about the sample. Scanning microscopy on the basis of various lens systems in synchrotron radiation sources provides a routine spatial resolution of now about 100 nanometer but in the foreseeable future a 10–20 nanometer spatial resolution can be expected. X-ray absorption spectrometry can also provide chemical (speciation information on the sample. All this makes X-ray microscopy attractive to many fields of science. In this paper the techniques are briefly reviewed and a number of applications in the earth, planetary and cosmos sciences are illustrated with state-of-the art examples, while applications in the environmental sciences and biology are also briefly discussed.

Experimental study for the feasibility of using hard x-rays for micro-XRF analysis of multilayered metals

Energy Technology Data Exchange (ETDEWEB)

Polese, C., E-mail: claudia.polese@lnf.infn.it; Dabagov, S. B.; Esposito, A.; Hampai, D.; Gorghinian, A.; Liedl, A. [LNF - INFN, Via E. Fermi 40, I-00044 Frascati (Italy); Ferretti, M. [ITABC - CNR, Via Salaria km 29.300, 00016 Montelibretti (Italy)

2014-07-15

Application of polycapillary optical systems to improve a spatial resolution for the μ-XRF analysis by focusing a primary x-ray beam and/or by collecting fluorescence emission is well known. The challenge is to optimize them in combination with x-ray source for exciting K-lines above 20 keV that could allow characterization of many materials composed by heavy elements. To pursue this goal, preliminary studies on possible polycapillary lens employment in thickness determination for multilayer metal materials will be presented in this work. In this paper, the results of first attempts of integrating PyMCA with Monte Carlo simulation code (XMI-MSIM) that takes into account the secondary fluorescence effects on quantitative analysis of homogeneous matrices, in particular, metal alloys, are presented.

Higher order structure analysis of nano-materials by spectral reflectance of laser-plasma soft x-ray

International Nuclear Information System (INIS)

Azuma, Hirozumi; Takeichi, Akihiro; Noda, Shoji

1995-01-01

We have proposed a new experimental arrangement to measure spectral reflectance of nano-materials for analyzing higher order structure with laser-plasma soft x-rays. Structure modification of annealed Mo/Si multilayers and a nylon-6/clay hybrid with poor periodicity was investigated. The measurement of the spectral reflectance of soft x-rays from laser-produced plasma was found to be a useful method for the structure analysis of nano-materials, especially those of rather poor periodicity

Thin Films for X-ray Optics

Science.gov (United States)

Conley, Raymond

Focusing x-rays with refraction requires an entire array of lens instead of a single element, each contributing a minute amount of focusing to the system. In contrast to their visible light counterparts, diffractive optics require a certain depth along the optical axis in order to provide sufficient phase shift. Mirrors reflect only at very shallow angles. In order to increase the angle of incidence, contribution from constructive interference within many layers needs to be collected. This requires a multilayer coating. Thin films have become a central ingredient for many x-ray optics due to the ease of which material composition and thickness can be controlled. Chapter 1 starts with a short introduction and survey of the field of x-ray optics. This begins with an explanation of reflective multilayers. Focusing optics are presented next, including mirrors, zone plates, refractive lenses, and multilayer Laue lens (MLL). The strengths and weaknesses of each "species" of optic are briefly discussed, alongside fabrication issues and the ultimate performance for each. Practical considerations on the use of thin-films for x-ray optics fabrication span a wide array of topics including material systems selection and instrumentation design. Sputter deposition is utilized exclusively for the work included herein because this method of thin-film deposition allows a wide array of deposition parameters to be controlled. This chapter also includes a short description of two deposition systems I have designed. Chapter 2 covers a small sampling of some of my work on reflective multilayers, and outlines two of the deposition systems I have designed and built at the Advanced Photon Source. A three-stripe double multilayer monochromator is presented as a case study in order to detail specifications, fabrication, and performance of this prolific breed of x-ray optics. The APS Rotary Deposition System was the first deposition system in the world designed specifically for multilayer

X-ray microscopy using grazing-incidence reflections optics

International Nuclear Information System (INIS)

Price, R.H.

1983-01-01

The role of Kirkpatrick-Baez microscopes as the workhorse of the x-ray imaging devices is discussed. This role is being extended with the development of a 22X magnification Kirkpatrick-Baez x-ray microscope with multilayer x-ray mirrors. These mirrors can operate at large angles, high x-ray energies, and have a narrow, well defined x-ray energy bandpass. This will make them useful for numerous experiments. However, where a large solid angle is needed, the Woelter microscope will still be necessary and the technology needed to build them will be useful for many other types of x-ray optics

Development of soft x-ray optical elements at the advanced photon research center

International Nuclear Information System (INIS)

Ishino, Masahiko; Yoda, Osamu; Koike, Masato; Sano, Kazuo; Iwasaki, Hiroshi

2003-01-01

We have been developing soft X-ray optical elements such as diffraction gratings and multilayer mirrors to applied to X-ray plasma sources and X-ray lasers and so on. In the field of the development of diffraction gratings, the laminar-type holographic gratings for flat-field spectrographs were found to be very effective in suppressing the higher orders and stray-light level. The fabricated holographic grating has a comparable spectral resolution to the replica commercial grating. In the development of the soft X-ray multilayer mirrors, the improvement of the heat stability of the Mo/Si multilayer was carried out. We have found that the Mo/SiO 2 /Si/SiO 2 multilayer having the SiO 2 layer thicknesses of 0.5 nm at the Si-on-Mo interface and of 1.5 nm at the Mo-on-Si interface has thermally stable structure up to 500degC and maintains high soft X-ray reflectivity after annealing at 400degC. In addition, we have developed an evaluation system capable of measuring the wavelength and angular characteristics of the reflectivity and diffraction efficiency of soft X-ray optical elements. (author)

Experimental study for the feasibility of using hard x-rays for micro-XRF analysis of multilayered metals

Directory of Open Access Journals (Sweden)

C. Polese

2014-07-01

Full Text Available Application of polycapillary optical systems to improve a spatial resolution for the μ-XRF analysis by focusing a primary x-ray beam and/or by collecting fluorescence emission is well known. The challenge is to optimize them in combination with x-ray source for exciting K-lines above 20 keV that could allow characterization of many materials composed by heavy elements. To pursue this goal, preliminary studies on possible polycapillary lens employment in thickness determination for multilayer metal materials will be presented in this work. In this paper, the results of first attempts of integrating PyMCA with Monte Carlo simulation code (XMI-MSIM that takes into account the secondary fluorescence effects on quantitative analysis of homogeneous matrices, in particular, metal alloys, are presented.

X-ray generation by femtosecond laser pulses and its application to soft X-ray imaging microscope

International Nuclear Information System (INIS)

Ikeda, Kenichi; Kotaki, Hideyuki; Nakajima, Kazuhisa

2002-01-01

We have developed laser-produced plasma X-ray sources using femtosecond laser pulses at 10Hz repetition rate in a table-top size in order to investigate basic mechanism of X-ray emission from laser-matter interactions and its application to a X-ray microscope. In a soft X-ray region over 5 nm wavelength, laser-plasma X-ray emission from a solid target achieved an intense flux of photons of the order of 1011 photons/rad per pulse with duration of a few 100 ps, which is intense enough to make a clear imaging in a short time exposure. As an application of laser-produced plasma X-ray source, we have developed a soft X-ray imaging microscope operating in the wavelength range around 14 nm. The microscope consists of a cylindrically ellipsoidal condenser mirror and a Schwarzshird objective mirror with highly-reflective multilayers. We report preliminary results of performance tests of the soft X-ray imaging microscope with a compact laser-produced plasma X-ray source

X-ray microscopy using grazing-incidence reflection optics

International Nuclear Information System (INIS)

Price, R.H.

1981-01-01

The Kirkpatrick-Baez microscopes are described along with their role as the workhorse of the x-ray imaging devices. This role is being extended with the development of a 22X magnification Kirkpatrick-Baez x-ray microscope with multilayer x-ray mirrors. These mirrors can operate at large angles, high x-ray energies, and have a narrow, well defined x-ray energy bandpass. This will make them useful for numerous experiments. However, where a large solid angle is needed, the Woelter microscope will still be necessary and the technology needed to build them will be useful for many other types of x-ray optics

X-ray fluorescence holography.

Science.gov (United States)

Hayashi, Kouichi; Happo, Naohisa; Hosokawa, Shinya; Hu, Wen; Matsushita, Tomohiro

2012-03-07

X-ray fluorescence holography (XFH) is a method of atomic resolution holography which utilizes fluorescing atoms as a wave source or a monitor of the interference field within a crystal sample. It provides three-dimensional atomic images around a specified element and has a range of up to a few nm in real space. Because of this feature, XFH is expected to be used for medium-range local structural analysis, which cannot be performed by x-ray diffraction or x-ray absorption fine structure analysis. In this article, we explain the theory of XFH including solutions to the twin-image problem, an advanced measuring system, and data processing for the reconstruction of atomic images. Then, we briefly introduce our recent applications of this technique to the analysis of local lattice distortions in mixed crystals and nanometer-size clusters appearing in the low-temperature phase of a shape-memory alloy.

X-ray fluorescence holography

International Nuclear Information System (INIS)

Hayashi, Kouichi; Happo, Naohisa; Hosokawa, Shinya; Hu Wen; Matsushita, Tomohiro

2012-01-01

X-ray fluorescence holography (XFH) is a method of atomic resolution holography which utilizes fluorescing atoms as a wave source or a monitor of the interference field within a crystal sample. It provides three-dimensional atomic images around a specified element and has a range of up to a few nm in real space. Because of this feature, XFH is expected to be used for medium-range local structural analysis, which cannot be performed by x-ray diffraction or x-ray absorption fine structure analysis. In this article, we explain the theory of XFH including solutions to the twin-image problem, an advanced measuring system, and data processing for the reconstruction of atomic images. Then, we briefly introduce our recent applications of this technique to the analysis of local lattice distortions in mixed crystals and nanometer-size clusters appearing in the low-temperature phase of a shape-memory alloy. (topical review)

Investigation of the hydrogen multilayered target H/T-D{sub 2} and muonic X-ray yields in ion implantation

Energy Technology Data Exchange (ETDEWEB)

Gheisari, R., E-mail: gheisari@pgu.ac.ir [Physics Department, Persian Gulf University, Bushehr 75169 (Iran, Islamic Republic of)

2011-12-21

This paper extends applications of the multilayered solid target H/T-D{sub 2}, which is kept at 3 K. The time evolutions of muonic tritium atoms ({mu}t) are obtained, by taking into account {mu}t production rate at different places of deuterium material. The apparatus H/T-D{sub 2} can be used for checking nuclear properties of implanted ions, which take part at muon transfer. Electromagnetic X-rays are generated by muon atomic transitions. The muonic X-ray transition energies are strongly affected by the size of nuclei. Here, a solid hydrogen-tritium (H/T) with a Almost-Equal-To 1 mm thick is used for {mu}t production. For ion implantation, the required amount of deuterium material is determined to be about 3.2 {mu}m. Moreover, the muonic X-ray yields are estimated and compared with those of the arrangement H/T-D{sub 2}. While the present target requires argon ion beam intensity nearly a factor of 2 times smaller; gives a relatively higher X-ray yield (15% enhancement per hour) at the energy 644 keV with the detection efficiency of Almost-Equal-To 1%.

Broad-band hard X-ray reflectors

DEFF Research Database (Denmark)

Joensen, K.D.; Gorenstein, P.; Hoghoj, P.

1997-01-01

Interest in optics for hard X-ray broad-band application is growing. In this paper, we compare the hard X-ray (20-100 keV) reflectivity obtained with an energy-dispersive reflectometer, of a standard commercial gold thin-film with that of a 600 bilayer W/Si X-ray supermirror. The reflectivity...... of the multilayer is found to agree extraordinarily well with theory (assuming an interface roughness of 4.5 Angstrom), while the agreement for the gold film is less, The overall performance of the supermirror is superior to that of gold, extending the band of reflection at least a factor of 2.8 beyond...... that of the gold, Various other design options are discussed, and we conclude that continued interest in the X-ray supermirror for broad-band hard X-ray applications is warranted....

Hydrogen absorption in epitaxial W/Nb(001) and polycrystalline Fe/Nb(110) multilayers studied in-situ by X-ray/neutron scattering techniques and X-ray absorption spectroscopy

International Nuclear Information System (INIS)

Klose, F.; Rehm, C.; Fieber-Erdmann, M.; Holub-Krappe, E.; Bleif, H. J.; Sowers, H.; Goyette, R.; Troger, L.; Maletta, H.

1999-01-01

Hydrogen can be absorbed in large quantities by 100 A thin Nb layers embedded in epitaxial W/Nb and polycrystalline Fe/Nb multilayers. The solubility and the hydrogen-induced structural changes of the host lattice are explored in-situ by small-angle neutron/X-ray reflectometry and high-angle diffraction. These measurements reveal for both systems that the relative out-of-plane expansion of the Nb layers is considerably larger than the relative increase of the Nb interplanar spacing indicating two distinctly different mechanisms of hydrogen absorption. In Fe/Nb multilayers, hydrogen expands the Nb interplanar spacing in a continuous way as function of the external pressure. In contrast, the Nb lattice expansion is discontinuous in epitaxial W/Nb multilayers: A jump in the Nb(002) Bragg reflection position occurs at a critical hydrogen pressure of 1 mbar. In-situ EXAFS spectroscopy also exhibits an irreversible expansion of the Nb lattice in the film plane for p H2 > 1 mbar. This can be regarded as a structural phase transition from an exclusively out-of-plane to a three-dimensionally expanded state at low and high hydrogen pressures, respectively

Soft X-ray spectrographs for solar observations

Science.gov (United States)

Bruner, M. E.

1988-01-01

Recent advances in soft X-ray spectrometery are reviewed, with emphasis on techniques for studying the windowless region from roughly 1-100 A. Recent technological developments considered include multilayer mirrors, large-format CCD detectors which are sensitive to X-rays, position-sensitive photon counting detectors, new kinds of X-ray films, and optical systems based on gratings with nonuniform ruling spacings. Improvements in the extent and accuracy of the atomic physics data sets on which the analysis of spectroscopic observatons depend are also discussed.

A mirror for lab-based quasi-monochromatic parallel x-rays.

Science.gov (United States)

Nguyen, Thanhhai; Lu, Xun; Lee, Chang Jun; Jung, Jin-Ho; Jin, Gye-Hwan; Kim, Sung Youb; Jeon, Insu

2014-09-01

A multilayered parabolic mirror with six W/Al bilayers was designed and fabricated to generate monochromatic parallel x-rays using a lab-based x-ray source. Using this mirror, curved bright bands were obtained in x-ray images as reflected x-rays. The parallelism of the reflected x-rays was investigated using the shape of the bands. The intensity and monochromatic characteristics of the reflected x-rays were evaluated through measurements of the x-ray spectra in the band. High intensity, nearly monochromatic, and parallel x-rays, which can be used for high resolution x-ray microscopes and local radiation therapy systems, were obtained.

Size effect in X-ray and electron diffraction patterns from hydroxyapatite particles

International Nuclear Information System (INIS)

Suvorova, E.I.; Buffat, P.-A.

2001-01-01

High-resolution transmission electron microscopy (HRTEM), electron microdiffraction, and X-ray diffraction were used to study hydroxyapatite specimens with particle sizes from a few nanometers to several hundreds of nanometers. Diffuse scattering (without clear reflections in transmission diffraction patterns) or strongly broadened peaks in X-ray diffraction patterns are characteristic for agglomerated hydroxyapatite nanocrystals. However, HRTEM and microdiffraction showed that this cannot be considered as an indication of the amorphous state of the matter but rather as the demonstration of size effect and the morphological and structural features of hydroxyapatite nanocrystals

Compressive flow behavior of Cu thin films and Cu/Nb multilayers containing nanometer-scale helium bubbles

International Nuclear Information System (INIS)

Li, N.; Mara, N.A.; Wang, Y.Q.; Nastasi, M.; Misra, A.

2011-01-01

Research highlights: → Firstly micro-pillar compression technique has been used to measure the implanted metal films. → The magnitude of radiation hardening decreased with decreasing layer thickness. → When thickness decreases to 2.5 nm, no hardening and no loss in deformability after implantation. -- Focused-ion-beam machined compression specimens were used to investigate the effect of nanometer-scale helium bubbles on the strength and deformability of sputter-deposited Cu and Cu/Nb multilayers with different layer thickness. The flow strength of Cu films increased by more than a factor of 2 due to helium bubbles but in multilayers, the magnitude of radiation hardening decreased with decreasing layer thickness. When the layer thickness decreases to 2.5 nm, insignificant hardening and no measurable loss in deformability is observed after implantation.

Hard X-ray emission spectroscopy with pink beam

Energy Technology Data Exchange (ETDEWEB)

Kvashnina, Kristina O.; Rossberg, Andre; Exner, Joerg; Scheinost, Andreas C. [Helmholtz-Zentrum Dresden-Rossendorf e.V., Dresden (Germany). Molecular Structures

2017-06-01

Valence-band X-ray emission spectroscopy (XES) with a ''pink beam'', i.e. a beam with large energy bandwidth produced by a double-multilayer monochromator, is introduced here to overcome the weak count rate of monochromatic beams produced by conventional double-crystal monochromators. Our results demonstrate that - in spite of the large bandwidth in the order of 100 eV - the high spectral resolution of the Johann-type spectrometer is maintained, while the two orders of magnitude higher flux greatly reduces the required counting time. The short working distance Johann-type X-ray emission spectrometer and multilayer monochromator is available at ROBL.

Discovery of a 115 Day Orbital Period in the Ultraluminous X-ray Source NGC 5408 X-1

Science.gov (United States)

Strohmayer, Tod E.

2009-01-01

We report the detection of a 115 day periodicity in SWIFT/XRT monitoring data from the ultraluminous X-ray source (ULX) NGC 5408 X-1. Our o ngoing campaign samples its X-ray flux approximately twice weekly and has now achieved a temporal baseline of ti 485 days. Periodogram ana lysis reveals a significant periodicity with a period of 115.5 +/- 4 days. The modulation is detected with a significance of 3.2 x 10(exp -4) . The fractional modulation amplitude decreases with increasing e nergy, ranging from 0.13 +/- 0.02 above 1 keV to 0.24 +/- 0.02 below 1 keV. The shape of the profile evolves as well, becoming less sharply peaked at higher energies. The periodogram analysis is consistent wi th a periodic process, however, continued monitoring is required to c onfirm the coherent nature of the modulation. Spectral analysis indic ates that NGC 5408 X-1 can reach 0.3 - 10 keV luminosities of approxi mately 2 x 10 40 ergs/s . We suggest that, like the 62 day period of the ULX in M82 (X41.4-1-60), the periodicity detected in NGC 5408 X-1 represents the orbital period of the black hole binary containing the ULX. If this is true then the secondary can only be a giant or super giant star.

Depth distribution of secondary phases in kesterite Cu2ZnSnS4 by angle-resolved X-ray absorption spectroscopy

Directory of Open Access Journals (Sweden)

J. Just

2017-12-01

Full Text Available The depth distribution of secondary phases in the solar cell absorber material Cu2ZnSnS4 (CZTS is quantitatively investigated using X-ray Absorption Near Edge Structure (XANES analysis at the K-edge of sulfur at varying incidence angles. Varying information depths from several nanometers up to the full thickness is achieved. A quantitative profile of the phase distribution is obtained by a self-consistent fit of a multilayer model to the XANES spectra for different angles. Single step co-evaporated CZTS thin-films are found to exhibit zinc and copper sulfide secondary phases preferentially at the front or back interfaces of the film.

Grazing incidence Fe-line telescopes using W/B4C multilayers

DEFF Research Database (Denmark)

Joensen, K. D.; Gorenstein, P.; Christensen, Finn Erland

1995-01-01

The loss of throughput observed at higher energies for traditional grazing-incidence X-ray telescopes coated with high-Z elements can be partly countered by employing multilayers on the outermost reflectors. Using 8-keV reflectivity data from a periodic W/B4C multilayer, the expected performance...

Heat stability evaluations of Co/SiO2 multilayers

International Nuclear Information System (INIS)

Ishino, Masahiko; Koike, Masato; Kanehira, Mika; Satou, Futami; Terauchi, Masami; Sano, Kazuo

2008-01-01

The heat stability of Co/SiO 2 multilayers was evaluated. Co/SiO 2 multilayer samples were deposited on Si substrate by means of an ion beam sputtering method, and annealed at temperatures from 100degC to 600degC in a vacuum furnace. For the structural and optical evaluations, small angle x-ray diffraction (XRD) measurements, soft x-ray reflectivity measurements, and transmission electron microscopy (TEM) observations were carried out. As the results, the Co/SiO 2 multilayer samples annealed up to 400degC maintained the initial multilayer structures, and kept almost the same soft x-ray reflectivities as that of the as-deposited Co/SiO 2 multilayer sample. A deterioration of the multilayer structure caused by the growth of Co grains was found on the Co/SiO 2 multilayer samples annealed over 500degC, and the soft x-ray reflectivity dropped in accordance with the deterioration of the multilayer structure. (author)

Periodicities in the X-ray Emission from the Solar Corona: SphinX and SOXS Observations

Science.gov (United States)

Steślicki, M.; Awasthi, A. K.; Gryciuk, M.; Jain, R.

The structure and evolution of the solar magnetic field is driven by a magnetohydrodynamic dynamo operating in the solar interior, which induces various solar activities that exhibit periodic variations on different timescales. Therefore, probing the periodic nature of emission originating from the solar corona may provide insights of the convection-zone-photosphere-corona coupling processes. We present the study of the mid-range periodicities, between rotation period (˜27 days) and the Schwabe cycle period (˜11 yr), in the solar soft X-ray emission, based on the data obtained by two instruments: SphinX and SOXS in various energy bands.

In situ characterization of delamination and crack growth of a CGO–LSM multi-layer ceramic sample investigated by X-ray tomographic microscopy

DEFF Research Database (Denmark)

Bjørk, Rasmus; Esposito, Vincenzo; Lauridsen, Erik Mejdal

2014-01-01

The densification, delamination and crack growth behavior in a Ce0.9Gd0.1O1.95 (CGO) and (La0.85Sr0.15)0.9MnO3 (LSM) multi-layer ceramic sample was studied using in situ X-ray tomographic microscopy (microtomography) to investigate the critical dynamics of crack propagation and delamination...... in a multilayered sample. Naturally occurring defects, caused by the sample preparation process, are shown not to be critical in sample degradation. Instead defects are nucleated during the debinding step. Crack growth is significantly faster along the material layers than perpendicular to them, and crack growth...

Hard X-ray/soft gamma-ray telescope designs for future astrophysics missions

DEFF Research Database (Denmark)

Ferreira, Desiree Della Monica; Christensen, Finn Erland; Pivovaroff, Michael J.

2013-01-01

We present several concept designs of hard X-ray/soft λ-ray focusing telescopes for future astrophysics missions. The designs are based on depth graded multilayer coatings. These have been successfully employed on the NuSTAR mission for energies up to 80 keV. Recent advances in demonstrating...

Ion beam analysis, corrosion resistance and nanomechanical properties of TiAlCN/CN{sub x} multilayer grown by reactive magnetron sputtering

Energy Technology Data Exchange (ETDEWEB)

Alemón, B.; Flores, M. [Departamento de Ingeniería de Proyectos, CUCEI, Universidad de Guadalajara, J. Guadalupe Zuno 48, Los Belenes, Zapopan, Jal. 45101 (Mexico); Canto, C. [Instituto de Física, UNAM, Avenida de la Investigación S/N, Coyoacán, Mexico, DF 04510 (Mexico); Andrade, E., E-mail: andrade@fisica.unam.mx [Instituto de Física, UNAM, Avenida de la Investigación S/N, Coyoacán, Mexico, DF 04510 (Mexico); Lucio, O.G. de [Instituto de Física, UNAM, Avenida de la Investigación S/N, Coyoacán, Mexico, DF 04510 (Mexico); Rocha, M.F. [ESIME-Z, Instituto Politécnico Nacional, ALM Zacatenco, Mexico, DF 07738 (Mexico); Broitman, E. [Thin Films Physics Division, IFM, Linköping University, SE-58183 Linköping (Sweden)

2014-07-15

A novel TiAlCN/CN{sub x} multilayer coating, consisting of nine TiAlCN/CN{sub x} periods with a top layer 0.5 μm of CN{sub x}, was designed to enhance the corrosion resistance of CoCrMo biomedical alloy. The multilayers were deposited by dc and RF reactive magnetron sputtering from Ti{sub 0.5}Al{sub 0.5} and C targets respectively in a N{sub 2}/Ar plasma. The corrosion resistance and mechanical properties of the multilayer coatings were analyzed and compared to CoCrMo bulk alloy. Ion beam analysis (IBA) and X-ray diffraction tests were used to measure the element composition profiles and crystalline structure of the films. Corrosion resistance was evaluated by means of potentiodynamic polarization measurements using simulated body fluid (SBF) at typical body temperature and the nanomechanical properties of the multilayer evaluated by nanoindentation tests were analyzed and compared to CoCrMo bulk alloy. It was found that the multilayer hardness and the elastic recovery are higher than the substrate of CoCrMo. Furthermore the coated substrate shows a better general corrosion resistance than that of the CoCrMo alloy alone with no observation of pitting corrosion.

Transmission X-ray microscopy for full-field nano-imaging of biomaterials

Science.gov (United States)

ANDREWS, JOY C; MEIRER, FLORIAN; LIU, YIJIN; MESTER, ZOLTAN; PIANETTA, PIERO

2010-01-01

Imaging of cellular structure and extended tissue in biological materials requires nanometer resolution and good sample penetration, which can be provided by current full-field transmission X-ray microscopic techniques in the soft and hard X-ray regions. The various capabilities of full-field transmission X-ray microscopy (TXM) include 3D tomography, Zernike phase contrast, quantification of absorption, and chemical identification via X-ray fluorescence and X-ray absorption near edge structure (XANES) imaging. These techniques are discussed and compared in light of results from imaging of biological materials including microorganisms, bone and mineralized tissue and plants, with a focus on hard X-ray TXM at ≤ 40 nm resolution. PMID:20734414

Transmission X-ray microscopy for full-field nano imaging of biomaterials.

Science.gov (United States)

Andrews, Joy C; Meirer, Florian; Liu, Yijin; Mester, Zoltan; Pianetta, Piero

2011-07-01

Imaging of cellular structure and extended tissue in biological materials requires nanometer resolution and good sample penetration, which can be provided by current full-field transmission X-ray microscopic techniques in the soft and hard X-ray regions. The various capabilities of full-field transmission X-ray microscopy (TXM) include 3D tomography, Zernike phase contrast, quantification of absorption, and chemical identification via X-ray fluorescence and X-ray absorption near edge structure imaging. These techniques are discussed and compared in light of results from the imaging of biological materials including microorganisms, bone and mineralized tissue, and plants, with a focus on hard X-ray TXM at ≤ 40-nm resolution. Copyright © 2010 Wiley-Liss, Inc.

X-ray grazing incidence study of inhomogeneous strain relaxation in Si/SiGe wires

International Nuclear Information System (INIS)

Hesse, A.; Zhuang, Y.; Holy, V.; Stangl, J.; Zerlauth, S.; Schaeffler, F.; Bauer, G.; Darowski, N.; Pietsch, U.

2003-01-01

The elastic strain relaxation in a series of dry-etched periodic multilayer Si/SiGe wire samples with different etching depths was investigated systematically by means of grazing incidence diffraction (GID). The samples were patterned by holographic lithography and reactive ion etching from a Si/SiGe superlattice grown by molecular beam epitaxy. Scanning electron microscopy and atomic force microscopy were employed to obtain information on the shape of the wires. The inhomogeneous strain distribution in the etched wires and in the non-etched part of the multilayers was derived by means of finite element calculations which were used as an input for simulations of the scattered X-ray intensities in depth dependent GID. The theoretical calculations for the scattered intensities are based on distorted-wave Born approximation. The unperturbed scattering potential was chosen with a reduced optical density corresponding to the ratio of wire width and wire period, in order to reflect the main interaction between the incident X-rays and the patterned samples. The calculations are in good agreement with the experimental data demonstrating the variation of strain relaxation with depth

X-rays and magnetism

International Nuclear Information System (INIS)

Fischer, Peter; Ohldag, Hendrik

2015-01-01

Magnetism is among the most active and attractive areas in modern solid state physics because of intriguing phenomena interesting to fundamental research and a manifold of technological applications. State-of-the-art synthesis of advanced magnetic materials, e.g. in hybrid structures paves the way to new functionalities. To characterize modern magnetic materials and the associated magnetic phenomena, polarized x-rays have emerged as unique probes due to their specific interaction with magnetic materials. A large variety of spectroscopic and microscopic techniques have been developed to quantify in an element, valence and site-sensitive way properties of ferro-, ferri-, and antiferromagnetic systems, such as spin and orbital moments, and to image nanoscale spin textures and their dynamics with sub-ns time and almost 10 nm spatial resolution. The enormous intensity of x-rays and their degree of coherence at next generation x-ray facilities will open the fsec time window to magnetic studies addressing fundamental time scales in magnetism with nanometer spatial resolution. This review will give an introduction into contemporary topics of nanoscale magnetic materials and provide an overview of analytical spectroscopy and microscopy tools based on x-ray dichroism effects. Selected examples of current research will demonstrate the potential and future directions of these techniques. (report on progress)

X-ray specular reflection and fluorescence study of nano-films

International Nuclear Information System (INIS)

Zheludeva, S.; Novikova, N.

2001-01-01

The techniques that combine the advantages of high-resolution structure sensitive x-ray methods with spectroscopic selectivity of data obtained are shown to be extremely promising for characterization of organic and inorganic nano films and nano structures. Fluorescence yield angular dependences exited by complicated evanescent wave / x-ray standing wave pattern at total reflection and glancing incidence can be used to detect structure position of different ions in organic systems and alien interfacial layers in inorganic multilayers;, to get information about interdiffusion at the interfaces of Langmuir- Blodgett (L-B) films and artificial inorganic - x-ray mirrors; to study ion permeation through L-B nano structures - models of biomembrans; to obtain nano - film thickness and density; to get precisely the parameters of small d-space multilayer mirrors, ets

X-ray-ultraviolet beam splitters for the Michelson interferometer

International Nuclear Information System (INIS)

Delmotte, Franck; Ravet, Marie-Francoise; Bridou, Francoise; Varniere, Francoise; Zeitoun, Philippe; Hubert, Sebastien; Vanbostal, Laurent; Soullie, Gerard

2002-01-01

With the aim of realizing a Michelson interferometer working at 13.9 nm, we have developed a symmetrical beam splitter with multilayers deposited on the front and back sides of a silicon nitride membrane. On the basis of the experimental optical properties of the membrane, simulations have been performed to define the multilayer structure that provides the highest reflectivity-transmission product. Optimized Mo-Si multilayers have been successfully deposited on both sides of the membrane by use of the ion-beam sputtering technique, with a thickness-period reproducibility of 0.1 nm. Measurements by means of synchrotron radiation at 13.9 nm and at an angle of 45 deg. provide a reflectivity of 14.2% and a transmission of 15.2% for a 60% s-polarized light, close to the simulated values. Such a beam splitter has been used for x-ray laser Michelson interferometry at 13.9 nm. The first interferogram is discussed

X-ray-ultraviolet beam splitters for the Michelson interferometer.

Science.gov (United States)

Delmotte, Franck; Ravet, Marie-Françoise; Bridou, Françoise; Varnière, Françoise; Zeitoun, Philippe; Hubert, Sébastien; Vanbostal, Laurent; Soullie, Gérard

2002-10-01

With the aim of realizing a Michelson interferometer working at 13.9 nm, we have developed a symmetrical beam splitter with multilayers deposited on the front and back sides of a silicon nitride membrane. On the basis of the experimental optical properties of the membrane, simulations have been performed to define the multilayer structure that provides the highest reflectivity-transmission product. Optimized Mo-Si multilayers have been successfully deposited on both sides of t he membrane by use of the ion-beam sputtering technique, with a thickness-period reproducibility of 0.1 nm. Measurements by means of synchrotron radiation at 13.9 nm and at an angle of 45 degrees provide a reflectivity of 14.2% and a transmission of 15.2% for a 60% s-polarized light, close to the simulated values. Such a beam splitter has been used for x-ray laser Michelson interferometry at 13.9 nm. The first interferogram is discussed.

X-ray supermirrors for BESSY II

International Nuclear Information System (INIS)

Erko, A.; Schaefers, F.; Vidal, B.; Yakshin, A.; Pietsch, U.; Mahler, W.

1995-01-01

X-ray multilayer supermirrors for the energy range up to 20 keV have been theoretically studied and experimentally measured with synchrotron radiation. A multilayer mirror with 50 W/Si bilayers with different thicknesses on the Si substrate has a smooth reflectivity of up to 32% in the whole energy range from 5 to 22 keV at a grazing incidence angle of 0.32 degree which is considerably larger than using total external reflection. copyright 1995 American Institute of Physics

Ultraviolet magnetic circular dichroism study and x-ray absorption spectroscopy of zinc-blende type CrAs multilayer

International Nuclear Information System (INIS)

Mizuguchi, M.; Manago, T.; Akinaga, H.; Yamada, T.; Yagi-Watanabe, K.; Yuri, M.; Chen, C.T.; Shirai, M.

2004-01-01

Full text: Half-metallic ferromagnets such as CrO 2 and Heusler alloys have attracted a great deal of attention due to its application to spin-dependent device. We have predicted by first principle calculations that zinc-blende (zb) type CrAs, which normally exists in a MnP type, shows a half-metallic band structure, and succeeded in fabrication of this film. However, the epitaxial growth with maintaining a zb structure was limited up to around the nominal thickness of 3 nm. In this contribution, ultraviolet magnetic circular dichroism (MCD) and x-ray absorption spectroscopy (XAS) of CrAs multilayers are reported. These multilayers include zb-CrAs layers and low-temperature GaAs layers stacked alternately, and total thicknesses of zb- CrAs are thicker than 3 nm. Incident beam with the photon energy from 4 to 8 eV were used, and samples were attached on a magnet with the magnetic field of 1.0 T for the MCD measurements. Strong signal with the peak top at 6.5 eV is observed in the MCD spectrum. It can be seen that the experimental spectrum has a good agreement with the theoretical one, which indicates the formation of a superstructure as designed. It was also clarified by the XAS measurement using incident beam from 560 to 600 eV that peak positions of these multilayers shift systematically according to the thickness of each layer. The CrAs/GaAs multilayer is also expected to possess a half-metallic property by the theoretical calculation, therefore, the present result shows the multilayer will be the promising candidate as the spin electronics material

KINOFORM LENSES - TOWARD NANOMETER RESOLUTION.

Energy Technology Data Exchange (ETDEWEB)

STEIN, A.; EVANS-LUTTERODT, K.; TAYLOR, A.

2004-10-23

While hard x-rays have wavelengths in the nanometer and sub-nanometer range, the ability to focus them is limited by the quality of sources and optics, and not by the wavelength. A few options, including reflective (mirrors), diffractive (zone plates) and refractive (CRL's) are available, each with their own limitations. Here we present our work with kinoform lenses which are refractive lenses with all material causing redundant 2{pi} phase shifts removed to reduce the absorption problems inherently limiting the resolution of refractive lenses. By stacking kinoform lenses together, the effective numerical aperture, and thus the focusing resolution, can be increased. The present status of kinoform lens fabrication and testing at Brookhaven is presented as well as future plans toward achieving nanometer resolution.

Structural and mechanical properties of titanium and titanium diboride monolayers and Ti/TiB2 multilayers

International Nuclear Information System (INIS)

Chu, K.; Lu, Y.H.; Shen, Y.G.

2008-01-01

Nano-multilayers represent a new class of engineering materials that are made up of alternating nanometer scale layers of two different components. In the present work a titanium (Ti) monolayer was combined with titanium diboride (TiB 2 ) to form a Ti/TiB 2 nano-multilayer. Designed experimental parameters enabled an evaluation of the effects of direct current bias voltage (U b ) and bilayer thickness (Λ) during multilayer deposition on the mechanical properties of reactively sputtered Ti/TiB 2 multilayer films. Their nanostructures and mechanical properties were characterized and analyzed using X-ray photoelectron spectroscopy (XPS), low-angle and high-angle X-ray diffraction (XRD), plan-view and cross-sectional high-resolution transmission electron microscopy (HRTEM), and microindentation measurements. Under the optimal bias voltage of U b = - 60 V, it was found that Λ (varied from 1.1 to 9.8 nm) was the most important factor which dominated the nanostructure and hardness. The hardness values obtained varied from 12 GPa for Ti and 15 GPa for TiB 2 monolayers, up to 33 GPa for the hardest Ti/TiB 2 multilayer at Λ = 1.9 nm. The observed hardness enhancement correlated to the layer thickness, followed a relation similar to the Hall-Petch strengthening dependence, with a generalized power of ∼ 0.6. In addition, the structural barriers between two materials (hcp Ti/amorphous TiB 2 ) and stress relaxation at interfaces within multilayer films resulted in a reduction of crack propagation and high-hardness

Micro-structural characterization of low resistive metallic Ni germanide growth on annealing of Ni-Ge multilayer

Directory of Open Access Journals (Sweden)

Mitali Swain

2015-07-01

Full Text Available Nickel-Germanides are an important class of metal semiconductor alloys because of their suitability in microelectronics applications. Here we report successful formation and detailed characterization of NiGe metallic alloy phase at the interfaces of a Ni-Ge multilayer on controlled annealing at relatively low temperature ∼ 250 °C. Using x-ray and polarized neutron reflectometry, we could estimate the width of the interfacial alloys formed with nanometer resolution and found the alloy stoichiometry to be equiatomic NiGe, a desirable low-resistance interconnect. We found significant drop in resistance (∼ 50% on annealing the Ni-Ge multilayer suggesting metallic nature of alloy phase at the interfaces. Further we estimated the resistivity of the alloy phase to be ∼ 59μΩ cm.

Pulse periods and the long-term variations of the X-ray pulsars VELA X-1 and Centaurus X-3

Science.gov (United States)

Tsunemi, Hiroshi

The paper reports recent determinations of the pulse period for two X-ray pulsars, Vela X-1 and Cen X-3, made in 1987 with the All Sky Monitor (ASM) on board the Ginga satellite. The heliocentric pulse periods are 283.09 + or - 0.01 s and 4.8229 + or - 0.0001 s, respectively. These are the longest and shortest values in their respective observational histories. The random walk model for the Vela X-1 pulsar can explain this result as well as those obtained previously. It is also noted that the pulse-period change for the Cen X-3 system shows a 9-yr periodicity. This is probably due to the activity of the companion star rather than to Doppler-shift variations due to a third body or the precession of the neutron star.

Stress Free Multilayer Coating for High Resolution X-ray Mirrors

Data.gov (United States)

National Aeronautics and Space Administration — Most of X-ray optics research and development in the US is to build a high resolution, large collecting area and light-weight optic, namely an soft X-ray mirror for...

X-Ray Timing Analysis of Cyg X-3 Using AstroSat/LAXPC: Detection of Milli-hertz Quasi-periodic Oscillations during the Flaring Hard X-Ray State

Energy Technology Data Exchange (ETDEWEB)

Pahari, Mayukh; Misra, Ranjeev [Inter-University Center for Astronomy and Astrophysics, Ganeshkhind, Pune 411007 (India); Antia, H M; Yadav, J S; Chauhan, Jai Verdhan; Chitnis, V R; Dedhia, Dhiraj; Katoch, Tilak; Madhwani, P; Shah, Parag [Tata Institute of Fundamental Research, Homi Bhabha Road, Mumbai 400005 (India); Agrawal, P C [UM-DAE Center of Excellence for Basic Sciences, University of Mumbai, Kalina, Mumbai 400098 (India); Manchanda, R K [University of Mumbai, Kalina, Mumbai 400098 (India); Paul, B, E-mail: mayukh@iucaa.in [Department of Astronomy and Astrophysics, Raman Research Institute, Bengaluru 560080 (India)

2017-11-01

We present here results from the X-ray timing and spectral analysis of the X-ray binary Cyg X-3 using observations from the Large Area X-ray proportional Counter on board AstroSat . Consecutive light curves observed over a period of one year show the binary orbital period of 17253.56 ± 0.19 s. Another low-amplitude, slow periodicity of the order of 35.8 ± 1.4 days is observed, which may be due to the orbital precession as suggested earlier by Molteni et al. During the rising binary phase, power density spectra from different observations during the flaring hard X-ray state show quasi-periodic oscillations (QPOs) at ∼5–8 mHz, ∼12–14 mHz, and ∼18–24 mHz frequencies at the minimum confidence of 99%. However, during the consecutive binary decay phase, no QPO is detected up to 2 σ significance. Energy-dependent time-lag spectra show soft lag (soft photons lag hard photons) at the mHz QPO frequency and the fractional rms of the QPO increases with the photon energy. During the binary motion, the observation of mHz QPOs during the rising phase of the flaring hard state may be linked to the increase in the supply of the accreting material in the disk and corona via stellar wind from the companion star. During the decay phase, the compact source moves in the outer wind region causing the decrease in supply of material for accretion. This may cause weakening of the mHz QPOs below the detection limit. This is also consistent with the preliminary analysis of the orbital phase-resolved energy spectra presented in this paper.

Magnetic Properties and Structural Study of Ni-Co/Cu Multilayers Prepared by Electrodeposition Method

Directory of Open Access Journals (Sweden)

M. Jafari Fesharaki

2015-07-01

Full Text Available Ni-Co/Cu multilayers have been grown by electrodeposition method from a single electrolyte (based on Ni(SO4.6H2O, Co(SO4.7H2O, Cu(SO4 and H3BO3 using galvanostatic control on titanium sublayers. The X-ray diffraction (XRD patterns confirmed the multilayered structure with the nanometer thicknesses. Also, electron diffraction x-ray (EDX  analysis confirmed the purity of deposited samples. The morphology of the samples was estimated by scanning electron microscope (SEM. Magnetoresistance (MR measurements were carried out at room temperature for the Ni-Co/Cu multilayers by measuring the resistivity in a magnetic fields varying between ±6kOe as a function of the Ni-Co and Cu layer thicknesses; (1 dCu(nm 4 and 3 dNi-Cu(nm 5. The Maximum value of giant magnetoresistance (GMR was obtained when the Ni-Co and Cu thicknesses were 4.0nm and 4.0nm respectively. The hysteresis loop of the samples at room temperature was studied using an alternating gradient force magnetometer (AGFM. Finally, the temperature dependence of magnetization for Ni-Co/Cu multilayers; (dNi-Cu(4nm/dCu(2nm and dNi-Cu(3nm/dCu(3nm measured by Faraday balance and decreasing the magnetization with increasing the temperature discussed according to electron scattering due to spin fluctuation.

Self-assembled iron oxide nanoparticle multilayer: x-ray and polarized neutron reflectivity

International Nuclear Information System (INIS)

Mishra, D; Benitez, M J; Petracic, O; Badini Confalonieri, G A; Szary, P; Brüssing, F; Devishvili, A; Toperverg, B P; Zabel, H; Theis-Bröhl, K; Vorobiev, A; Konovalov, O; Paulus, M; Sternemann, C

2012-01-01

We have investigated the structure and magnetism of self-assembled, 20 nm diameter iron oxide nanoparticles covered by an oleic acid shell for scrutinizing their structural and magnetic correlations. The nanoparticles were spin-coated on an Si substrate as a single monolayer and as a stack of 5 ML forming a multilayer. X-ray scattering (reflectivity and grazing incidence small-angle scattering) confirms high in-plane hexagonal correlation and a good layering property of the nanoparticles. Using polarized neutron reflectivity we have also determined the long range magnetic correlations parallel and perpendicular to the layers in addition to the structural ones. In a field of 5 kOe we determine a magnetization value of about 80% of the saturation value. At remanence the global magnetization is close to zero. However, polarized neutron reflectivity reveals the existence of regions in which magnetic moments of nanoparticles are well aligned, while losing order over longer distances. These findings confirm that in the nanoparticle assembly the magnetic dipole–dipole interaction is rather strong, dominating the collective magnetic properties at room temperature. (paper)

Self-assembled iron oxide nanoparticle multilayer: x-ray and polarized neutron reflectivity.

Science.gov (United States)

Mishra, D; Benitez, M J; Petracic, O; Badini Confalonieri, G A; Szary, P; Brüssing, F; Theis-Bröhl, K; Devishvili, A; Vorobiev, A; Konovalov, O; Paulus, M; Sternemann, C; Toperverg, B P; Zabel, H

2012-02-10

We have investigated the structure and magnetism of self-assembled, 20 nm diameter iron oxide nanoparticles covered by an oleic acid shell for scrutinizing their structural and magnetic correlations. The nanoparticles were spin-coated on an Si substrate as a single monolayer and as a stack of 5 ML forming a multilayer. X-ray scattering (reflectivity and grazing incidence small-angle scattering) confirms high in-plane hexagonal correlation and a good layering property of the nanoparticles. Using polarized neutron reflectivity we have also determined the long range magnetic correlations parallel and perpendicular to the layers in addition to the structural ones. In a field of 5 kOe we determine a magnetization value of about 80% of the saturation value. At remanence the global magnetization is close to zero. However, polarized neutron reflectivity reveals the existence of regions in which magnetic moments of nanoparticles are well aligned, while losing order over longer distances. These findings confirm that in the nanoparticle assembly the magnetic dipole-dipole interaction is rather strong, dominating the collective magnetic properties at room temperature.

Design and development of the SIMBOL-X hard x-ray optics

Science.gov (United States)

Pareschi, G.; Attinà, P.; Basso, S.; Borghi, G.; Burkert, W.; Buzzi, R.; Citterio, O.; Civitani, M.; Conconi, P.; Cotroneo, V.; Cusumano, G.; Dell'Orto, E.; Freyberg, M.; Hartner, G. D.; Gorenstein, P.; Mattaini, E.; Mazzoleni, F.; Parodi, G.; Romaine, S.; Spiga, D.; Tagliaferri, G.; Valtolina, R.; Valsecchi, G.; Vernani, D.

2008-07-01

The SIMBOL-X formation-flight X-ray mission will be operated by ASI and CNES in 2014, with a large participation of the French and Italian high energy astrophysics scientific community. Also German and US Institutions are contributing in the implementation of the scientific payload. Thanks to the formation-flight architecture, it will be possible to operate a long (20 m) focal length grazing incidence mirror module, formed by 100 confocal multilayer-coated Wolter I shells. This system will allow us to focus X-rays over a very broad energy band, from 0.5 keV up to 80 keV and beyond, with more than two orders of magnitude improvement in angular resolution (20 arcsec HEW) and sensitivity (0.5 µCrab on axis @30 keV) compared to non focusing detectors used so far. The X-ray mirrors will be realized by Ni electroforming replication, already successfully used for BeppoSAX, XMM-Newton, and JET-X/SWIFT; the thickness trend will be about two times less than for XMM, in order to save mass. Multilayer reflecting coatings will be implemented, in order to improve the reflectivity beyond 10 keV and to increase the field of view 812 arcmin at 30 keV). In this paper, the SIMBOL-X optics design, technology and implementation challenges will be discussed; it will be also reported on recent results obtained in the context of the SIMBOL-X optics development activities.

Fatigue expectations in a molybdenum/silicon multilayer under pulsed soft X-ray radiation

International Nuclear Information System (INIS)

Weber, F.J.; Kassner, M.E.; Stearns, D.G.

1995-01-01

The temperature rise in a Mo/a-Si multilayer x-ray reflective film due to radiation absorption is modeled for the first condenser mirror in a projection lithography system such as the one designed by the Advanced Microtechnology Program at LLNL. The radiation load is pulsed at 1000 Hz with a time average intensity of 500mW/cm 2 . This intensity is the expected maximum on the first condenser mirror. The temperature rise is calculated using the integral transform technique. The film is assumed to have the thermal properties of its poorly conducting substrate, yielding a more conservative (higher) temperature estimate. The surface temperature rise is found to range between 35.6 degrees C and 76.3 degrees C. The stress due to this rise is greatest in the molybdenum film and ranges between 73MPa and 166MPa compressive. This fluctuating stress level, however, is believed to be insufficient, by a factor of five or so, to cause fatigue failure of the film

Shield device for controlling the dose of x-rays applied in an x-ray machine

International Nuclear Information System (INIS)

Charrier, P.

1983-01-01

This invention provides an improved shield for use with an x-ray machine. The shield can control the dose of x-rays applied by the machine in different areas without affecting the power of the x-rays. This is achieved with a shield especially designed and positioned to intercept with x-rays for longer or shorter periods in different areas during the taking of the picture, but not for the whole period of time necessary for taking this picture. Each area of the subject being x-rayed is exposed to full power x-rays. However, owing to the shield, the areas that require smaller dose receive these full power x-rays for a shorter portion of the time required to take the picture while the other areas that require larger dose of x-rays, receive the full power x-rays for a longer portion of the full period of time required to take the picture. To ensure this differential exposure, the shield is placed through the path of the x-rays and rotated about an axis which is generally transverse to the direction of travel of the x-rays to cut out some of said x-rays for different portions of the period of time necessary for taking the picture. The shield is preferably shaped to intercept x-rays for a longer period in some areas than in others depending on the required doses. A plurality of differently shaped shields can be provided to suit different picture taking situations

Interfacial effects in multilayers

International Nuclear Information System (INIS)

Barbee, T.W. Jr.

1998-01-01

Interfacial structure and the atomic interactions between atoms at interfaces in multilayers or nano-laminates have significant impact on the physical properties of these materials. A technique for the experimental evaluation of interfacial structure and interfacial structure effects is presented and compared to experiment. In this paper the impact of interfacial structure on the performance of x-ray, soft x-ray and extreme ultra-violet multilayer optic structures is emphasized. The paper is concluded with summary of these results and an assessment of their implications relative to multilayer development and the study of buried interfaces in solids in general

Structure and magnetism in Co/X, Fe/Si, and Fe/(FeSi) multilayers

Science.gov (United States)

Franklin, Michael Ray

Previous studies have shown that magnetic behavior in multilayers formed by repeating a bilayer unit comprised of a ferromagnetic layer and a non-magnetic spacer layer can be affected by small structural differences. For example, a macroscopic property such as giant magnetoresistance (GMR) is believed to depend significantly upon interfacial roughness. In this study, several complimentary structural probes were used to carefully characterize the structure of several sputtered multilayer systems-Co/Ag, Co/Cu, Co/Mo, Fe/Si, and Fe//[FeSi/]. X-ray diffraction (XRD) studies were used to examine the long-range structural order of the multilayers perpendicular to the plane of the layers. Transmission electron diffraction (TED) studies were used to probe the long-range order parallel to the layer plane. X-ray Absorption Fine Structure (XAFS) studies were used to determine the average local structural environment of the ferromagnetic atoms. For the Co/X systems, a simple correlation between crystal structure and saturation magnetization is discovered for the Co/Mo system. For the Fe/X systems, direct evidence of an Fe-silicide is found for the /[FeSi/] spacer layer but not for the Si spacer layer. Additionally, differences were observed in the magnetic behavior between the Fe in the nominally pure Fe layer and the Fe contained in the /[FeSi/] spacer layers.

Dynamical X-ray scattering from the relaxed structures

International Nuclear Information System (INIS)

Benediktovitch, A.; Feranchuk, I.; Ulyanenkov, A.

2009-01-01

High-resolution X-ray diffraction is now widely used analytical tool for investigation of nano scale multilayered structures in semiconductor and optical technologies. The HRXRD method delivers unique information on the crystallographic lattice of the samples, concentration of solid solutions, lattice mismatches, layer thicknesses, defect distribution, and relaxation degree of the epitaxial layers. The evaluation of the experimental results, however, requires a robust and precise theory due to complex dynamical scattering of X-rays from near perfect crystallographic structure of the samples. Usually, the Takagi-Taupin approach [1] or the recurrent matrix methods [2] are used for the simulation of the X-ray diffraction profiles from the epitaxial multilayered structures. The use of these theories, however, becomes essentially difficult, when the lateral lattice mismatches are present in multilayers, for example, in the case of partially or fully relaxed epitaxially grown samples. In the present work, the general solution of this problem is found analytically. The angular divergence of the incident beam is also considered and the algorithm for the diffracted profile mapping in the reciprocal space is developed. The experimental reciprocal space mapping of typical AlGaN/GaN/AlN samples with partially relaxed layers is compared to the simulated maps, which describe well the location and character of the diffraction spots caused by different layers. (author)

Development of X-ray photoelectron microscope with a compact X-ray source generated by line-focused laser irradiation

International Nuclear Information System (INIS)

Yamaguchi, N.; Takahashi, Z.; Nishimura, Y.; Watanabe, K.; Okamoto, Y.; Sakata, A.; Azuma, H.; Hara, T.

2005-01-01

A laboratory-sized X-ray photoelectron microscope was constructed using a compact X-ray source produced by line-focused laser irradiation. The system is a scanning type photoelectron microscope where X-ray beam is micro-focused via Schwarzschild optics. A compact laser-plasma X-ray source has been developed with a YAG laser, a line-focus lens assembly, an Al tape-target driver and a debris prevention system. The 13.1 nm X-ray was delivered along line plasma whose length was 0.6 or 11 mm with higher intensity than that from a point-focused source. The Schwarzschild optics having the designed demagnification of 224, which was coated with Mo/Si multilayers for 13.1 nm X-ray, was set on the beamline 1 m distant from the source. The electron energy analyser was a spherical capacitor analyser with the photoelectron image detection system that was suited for detection of vast photoelectrons excited by an X-ray pulse of ns-order duration. The spatial resolution less than 5 μm has been confirmed from the variation of As 3d electron intensity along the position of the GaAs sample coated with a photo-resist test pattern

Effect of Ag film thickness on the optical and the electrical properties in CuAlO2/Ag/CuAlO2 multilayer films grown on glass substrates

International Nuclear Information System (INIS)

Oh, Dohyun; No, Young Soo; Kim, Su Youn; Cho, Woon Jo; Kwack, Kae Dal; Kim, Tae Whan

2011-01-01

Research highlights: The CuAlO 2 /Ag/CuAlO 2 multilayer films were grown on glass substrates using radio-frequency magnetron sputtering at room temperature. Effects of Ag film thickness on the optical and the electrical properties in CuAlO 2 /Ag/CuAlO 2 multilayer films grown on glass substrates were investigated. X-ray diffraction patterns showed that the phase of the CuAlO 2 layer was amorphous. Atomic force microscopy images showed that Ag films with a thickness of a few nanometers had island structures. The morphology Ag films with a thickness of 8 nm was uniform. The morphology of the Ag films inserted in the CuAlO 2 films significantly affected the optical transmittance and the resistivity of the CuAlO 2 films deposited on glass substrates. The maximum transmittance of the CuAlO 2 /Ag/CuAlO 2 multilayer films with a thickness of 8 nm was 89.16%. The resistivity of the CuAlO 2 /Ag/CuAlO 2 multilayer films with an Ag film thickness of 18 nm was as small as about 2.8 x 10 -5 Ω cm. The resistivity of the CuAlO 2 /Ag/CuAlO 2 multilayer films was decreased as a result of the thermal annealing treatment. These results indicate that CuAlO 2 /Ag/CuAlO 2 multilayer films grown on glass substrates hold promise for potential applications as TCO films in solar cells. - Abstract: Effects of Ag film thickness on the optical and the electrical properties in CuAlO 2 /Ag/CuAlO 2 multilayer films grown on glass substrates were investigated. Atomic force microscopy images showed that Ag films with a thickness of a few nanometers had island structures. X-ray diffraction patterns showed that the phase of the CuAlO 2 layer was amorphous. The resistivity of the 40 nm-CuAlO 2 /18 nm-Ag/40 nm-CuAlO 2 multilayer films was 2.8 x 10 -5 Ω cm, and the transmittance of the multilayer films with an Ag film thickness of 8 nm was approximately 89.16%. These results indicate that CuAlO 2 /Ag/CuAlO 2 multilayer films grown on glass substrates hold promise for potential applications as

Swift Detection of a 65 Day X-Ray Period from the Ultraluminous Pulsar NGC 7793 P13

Energy Technology Data Exchange (ETDEWEB)

Hu, Chin-Ping; Ng, C.-Y. [Department of Physics, The University of Hong Kong, Pokfulam Road (Hong Kong); Li, K. L. [Department of Physics and Astronomy, Michigan State University, East Lansing, MI 48824 (United States); Kong, Albert K. H. [Institute of Astronomy and Department of Physics, National Tsing Hua University, Hsinchu 30013, Taiwan (China); Lin, Lupin Chun-Che, E-mail: cphu@hku.hk, E-mail: liliray@pa.msu.edu [Institute of Astronomy and Astrophysics, Academia Sinica, Taipei 10617, Taiwan (China)

2017-01-20

NGC 7793 P13 is an ultraluminous X-ray source harboring an accreting pulsar. We report on the detection of a ∼65 day period X-ray modulation with Swift observations in this system. The modulation period found in the X-ray band is P = 65.05 ± 0.10 days and the profile is asymmetric with a fast rise and a slower decay. On the other hand, the u -band light curve collected by Swift UVOT confirmed an optical modulation with a period of P = 64.24 ± 0.13 days. We explored the phase evolution of the X-ray and optical periodicities and propose two solutions. A superorbital modulation with a period of ∼2700–4700 days probably caused by the precession of a warped accretion disk is necessary to interpret the phase drift of the optical data. We further discuss the implication if this ∼65 day periodicity is caused by the superorbital modulation. Estimated from the relationship between the spin-orbital and orbital-superorbital periods of known disk-fed high-mass X-ray binaries, the orbital period of P13 is roughly estimated as 3–7 days. In this case, an unknown mechanism with a much longer timescale is needed to interpret the phase drift. Further studies on the stability of these two periodicities with a long-term monitoring could help us to probe their physical origins.

X-ray holographic imaging of magnetic order in meander domain structures

Directory of Open Access Journals (Sweden)

Jaouen Nicolas

2013-01-01

Full Text Available We performed x-ray holography experiments using synchrotron radiation. By analyzing the scattering of coherent circularly polarized x-rays tuned at the Co-2p resonance, we imaged perpendicular magnetic domains in a Co/Pd multilayer. We compare results obtained for continuous and laterally confined films.

Magnetic imaging by dichroic x-ray holography

International Nuclear Information System (INIS)

Eisebitt, S.; Loergen, M.; Eberhardt, W.; Luening, M.; Schlotter, W.F.; Stoehr, J.; Hellwig, O.

2004-01-01

Full text: While holography has evolved to a powerful technique in the visible spectral range, it is difficult to apply at shorter wavelength as no intrinsically coherent (soft) x-ray laser is available as a light source. The progression from visible light towards shorter wavelength is motivated by the increase in spatial resolution that can be achieved. Of equal importance is the possibility to exploit special contrast mechanisms provided by scattering in resonance with transitions between electronic core and valence levels. These contrast mechanisms can be utilized in x-ray holography to form a spectroscopic image of the sample, in analogy to spectromicroscopy. So far, successful x-ray spectroholography has not been reported due to the experimental difficulties associated with the short wavelength and the limited coherent photon flux available. We present images of magnetic domain patterns forming in thin film Co-Pt multilayers, obtained by spectroholography at a wavelength of 1.59 nm. At this wavelength, we exploit x ray magnetic dichroism at the Co 2p 3/2 level in a Fourier transform holography experiment. Holography at this wavelength was made possible by combining nanostructured masks with coherence l tered synchrotron radiation from an undulator source in the experimental setup. The magnetic multilayers have perpendicular anisotropy and are probed using circular polarized x-rays. Dichroic holograms are recorded by combining measurements with positive and negative helicities. The spectroholograms can be numerically inverted to show the pure magnetic sample structure, such as labyrinth or stripe domains. Currently, we achieve a spatial resolution of 100 nm in the magnetic image. The advantages and limitations of this technique will be compared to other lensless imaging techniques such as over sampling phasing. The future prospects of imaging techniques based on coherent scattering are discussed in the context of the current development of free electron x-ray

Multilayer on-chip stacked Fresnel zone plates: Hard x-ray fabrication and soft x-ray simulations

Energy Technology Data Exchange (ETDEWEB)

Li, Kenan; Wojcik, Michael J.; Ocola, Leonidas E.; Divan, Ralu; Jacobsen, Chris

2015-11-01

Fresnel zone plates are widely used as x-ray nanofocusing optics. To achieve high spatial resolution combined with good focusing efficiency, high aspect ratio nanolithography is required, and one way to achieve that is through multiple e-beam lithography writing steps to achieve on-chip stacking. A two-step writing process producing 50 nm finest zone width at a zone thickness of 1.14 µm for possible hard x-ray applications is shown here. The authors also consider in simulations the case of soft x-ray focusing where the zone thickness might exceed the depth of focus. In this case, the authors compare on-chip stacking with, and without, adjustment of zone positions and show that the offset zones lead to improved focusing efficiency. The simulations were carried out using a multislice propagation method employing Hankel transforms.

Laboratory soft x-ray microscopy and tomography

International Nuclear Information System (INIS)

Bertilson, Michael

2011-01-01

Soft x-ray microscopy in the water-window (λ = 2.28 nm - 4.36 nm) is based on zone-plate optics and allows high-resolution imaging of, e.g., cells and soils in their natural or near-natural environment. Three-dimensional imaging is provided via tomographic techniques, soft x-ray cryo tomography. However, soft x-ray microscopes with such capabilities have been based on large-scale synchrotron x-ray facilities, thereby limiting their accessibility for a wider scientific community. This Thesis describes the development of the Stockholm laboratory soft x-ray microscope to three-dimensional cryo tomography and to new optics-based contrast mechanisms. The microscope relies on a methanol or nitrogen liquid-jet laser-plasma source, normal-incidence multilayer or zone-plate condenser optics, in-house fabricated zone-plate objectives, and allows operation at two wavelengths in the water-window, λ = 2.48 nm and λ = 2.48 nm. With the implementation of a new state-of-the-art normal-incidence multilayer condenser for operation at λ = 2.48 nm and a tiltable cryogenic sample stage the microscope now allows imaging of dry, wet or cryo-fixed samples. This arrangement was used for the first demonstration of laboratory soft x-ray cryo microscopy and tomography. The performance of the microscope has been demonstrated in a number of experiments described in this Thesis, including, tomographic imaging with a resolution of 140 nm, cryo microscopy and tomography of various cells and parasites, and for studies of aqueous soils and clays. The Thesis also describes the development and implementation of single-element differential-interference and Zernike phase-contrast zone-plate objectives. The enhanced contrast provided by these optics reduce exposure times or lowers the dose in samples and are of major importance for harder x-ray microscopy. The implementation of a high-resolution 50 nm compound zone-plate objective for sub-25-nm resolution imaging is also described. All experiments

X-ray grazing incidence diffraction from multilayers

Energy Technology Data Exchange (ETDEWEB)

Tixier, S.; Boeni, P.; Swygenhoven, H. van; Horisberger, M. [Paul Scherrer Inst. (PSI), Villigen (Switzerland)

1997-09-01

Grazing incidence scattering geometries using synchrotron radiation have been applied in order to characterise the roughness profiles and the structural coherence of multilayers. The lateral correlation length of the roughness profiles was evaluated using diffuse reflectivity in the `out of plane` geometry. This type of measurement is the only diffuse reflectivity technique allowing large lateral momentum transfer. It is typically suitable for correlation lengths smaller than 1000 A. The lateral structural coherence length of Ni{sub 3}Al/Ni multilayers as a function of the layer thickness was obtained by grazing incidence diffraction (GID). 3 figs., 1 ref.

Sectioning of multilayers to make a multilayer Laue lens

International Nuclear Information System (INIS)

Kang, Hyon Chol; Stephenson, G. Brian; Liu Chian; Conley, Ray; Khachatryan, Ruben; Wieczorek, Michael; Macrander, Albert T.; Yan Hanfei; Maser, Joerg; Hiller, Jon; Koritala, Rachel

2007-01-01

We report a process to fabricate multilayer Laue lenses (MLL's) by sectioning and thinning multilayer films. This method can produce a linear zone plate structure with a very large ratio of zone depth to width (e.g., >1000), orders of magnitude larger than can be attained with photolithography. Consequently, MLL's are advantageous for efficient nanofocusing of hard x rays. MLL structures prepared by the technique reported here have been tested at an x-ray energy of 19.5 keV, and a diffraction-limited performance was observed. The present article reports the fabrication techniques that were used to make the MLL's

Hardness enhancement and oxidation resistance of nanocrystalline TiN/Mo xC multilayer films

International Nuclear Information System (INIS)

Liu, Q.; Wang, X.P.; Liang, F.J.; Wang, J.X.; Fang, Q.F.

2006-01-01

In this paper the influence of the layer's microstructure on the hardness enhancement in multilayer nanocrystalline films and the oxidation resistance are studied. The TiN/Mo x C multilayer films at different modulation period, and Mo x C and TiN monolayer films were deposited on the (0 0 1) silicon wafers and molybdenum sheets by rf and dc magnetron sputtering. The monolayer TiN films with a thickness of about 2 μm are of pure face-center cubic TiN phase, while the monolayer Mo x C films consist of two phases, one of which is body-center cubic Mo and the other is hexagonal Mo 2 C as determined by XRD. The coarse columnar grains of about 200 nm in the monolayer TiN films become much smaller or disappear in the multilayer films. The hardness enhancement of the multilayer films takes place at the modulation period of 320 nm, which can reach to 26 GPa and is much higher than the values of Mo x C and TiN monolayer films. This enhancement in hardness can be explained as the decrease in the size and/or disappearance of columnar grains in the TiN layer. The Young's modulus in the temperature range from 100 to 400 deg. C increases with decreasing modulation period. It is found that about 100 nm thick TiN films can increase largely the oxidation resistance of Mo x C films

Development of the measurement system with interferometers for ultraprecise X-ray mirror

CERN Document Server

Yamauchi, K; Mimura, H

2003-01-01

A figure measurement system with a stitching method has been developed for evaluation and fabrication of the ultraprecise hard X-ray mirror optics. This system was constructed by two interferometers. One is the Michelson-type microscopic interferometer which is improved to keep the focus distance within 0.1 mu m. Another is the Fizeau's interferometer employed to compensate stitching error in the long spatial wavelength range. To estimate the absolute accuracy in this figure measurement system, the reflection X-ray intensity distributions of flat and aspherical mirrors, which are fabricated by us, were predicted by wave-optical simulation based on measured profile an compared with actually observed distributions. As the result, they are in good agreements. These agreements prove that the developed system has sub-nanometer absolute accuracy in all the spatial wavelength range longer than 0.5mm, because sub-nanometer figure error in those spatial wavelength ranges are known to affect reflection X-ray intensity ...

Periodic Recurrence Patterns In X-Ray Solar Flare Appearances

Science.gov (United States)

Gyenge, N.; Erdélyi, R.

2018-06-01

The temporal recurrence of micro-flare events is studied for a time interval before and after of major solar flares. Our sample is based on the X-ray flare observations by the Geostationary Operational Environmental Satellite (GOES) and Reuven Ramaty High Energy Solar Spectroscopic Imager (RHESSI). The analyzed data contain 1330/301 M-class and X-class GOES/RHESSI energetic solar flares and 4062/4119 GOES/RHESSI micro-flares covering the period elapse since 2002. The temporal analysis of recurrence, by Fast Fourier Transform, of the micro-flares, shows multiple significant periods. Based on the GOES and RHESSI data, the temporal analysis also demonstrates that multiple periods manifest simultaneously in both statistical samples without any significant shift over time. In the GOES sample, the detected significant periods are: 11.33, 5.61, 3.75, 2.80, and 2.24 minutes. The RHESSI data show similar significant periods at 8.54, 5.28, 3.66, 2.88, and 2.19 minutes. The periods are interpreted as signatures of standing oscillations, with the longest period (P 1) being the fundamental and others being higher harmonic modes. The period ratio of the fundamental and higher harmonics (P 1/P N ) is also analyzed. The standing modes may be signatures of global oscillations of the entire solar atmosphere encompassing magnetized plasma from the photosphere to the corona in active regions.

X-ray optics for scanning fluorescence microscopy and other applications

International Nuclear Information System (INIS)

Ryon, R.W.; Warburton, W.K.

1992-05-01

Scanning x-ray fluorescence microscopy is analogous to scanning electron microscopy. Maps of chemical element distribution are produced by scanning with a very small x-ray beam. Goal is to perform such scanning microscopy with resolution in the range of <1 to 10 μm, using standard laboratory x-ray tubes. We are investigating mirror optics in the Kirkpatrick-Baez (K-B) configuration. K-B optics uses two curved mirrors mounted orthogonally along the optical axis. The first mirror provides vertical focus, the second mirror provides horizontal focus. We have used two types of mirrors: synthetic multilayers and crystals. Multilayer mirrors are used with lower energy radiation such as Cu Kα. At higher energies such as Ag Kα, silicon wafers are used in order to increase the incidence angles and thereby the photon collection efficiency. In order to increase the surface area of multilayers which reflects x-rays at the Bragg angle, we have designed mirrors with the spacing between layers graded along the optic axis in order to compensate for the changing angle of incidence. Likewise, to achieve a large reflecting surface with silicon, the wafers are placed on a specially designed lever arm which is bent into a log spiral by applying force at one end. In this way, the same diffracting angle is maintained over the entire surface of the wafer, providing a large solid angle for photon collection

X-ray characterisation of single GaAs nanorods grown on Si

Energy Technology Data Exchange (ETDEWEB)

Biermanns, Andreas; Davydok, A.; Pietsch, Ullrich [Universitaet Siegen (Germany). Festkoerperphysik; Breuer, Steffen; Geelhaar, Lutz [Paul-Drude-Institut fuer Festkoerperelektronik, Berlin (Germany)

2010-07-01

Semiconductor nanorods are of particular interest for new semiconductor devices. The nanorod approach can be used to form radial or axial heterostructures of materials with a large lattice mismatch. For the inspection of average structural parameters of the nanorods, typically X-ray or electron diffraction techniques are used. Alternatively, transmission electron microscopy can be used to inspect few individual nanorods after respective sample preparation. Complementary, recent developments in X-ray optics allow to focus a synchrotron beam down to the nanometer scale and to perform nondestructive diffraction studies at several individual nano-objects grown the same substrate. In this contribution we report on X-ray diffraction studies at individual GaAs nanorods grown Au seed-free on a Si[111] substrate. Due to the nanometer-sized x-ray beam, size and lattice parameters of individual nanorods could be measured and compared to the value obtained from the whole ensemble. Using the coherence properties of the focused beam we could observe speckle-like interference fringes in the surrounding of particular sensitive Bragg reflections which are a measure for the appearance of stacking faults within the nanorods. The separation of the speckles could be used to estimate the number of stacking faults and the size of the coherently scattering nanorod-segments.

Optical spectroscopy of the Be/X-ray binary V850 Centauri/GX 304-1 during faint X-ray periodical activity

Science.gov (United States)

Malacaria, C.; Kollatschny, W.; Whelan, E.; Santangelo, A.; Klochkov, D.; McBride, V.; Ducci, L.

2017-07-01

Context. Be/X-ray binaries (BeXRBs) are the most populous class of high-mass X-ray binaries. Their X-ray duty cycle is tightly related to the optical companion wind activity, which in turn can be studied through dedicated optical spectroscopic observations. Aims: We study optical spectral features of the Be circumstellar disk to test their long-term variability and their relation with the X-ray activity. Special attention has been given to the Hα emission line, one of the best tracers of the disk conditions. Methods: We obtained optical broadband medium resolution spectra from a dedicated campaign with the Anglo-Australian Telescope and the Southern African Large Telescope in 2014-2015. Data span over one entire binary orbit, and cover both X-ray quiescent and moderately active periods. We used Balmer emission lines to follow the evolution of the circumstellar disk. Results: We observe prominent spectral features, like double-peaked Hα and Hβ emission lines. The HαV/R ratio significantly changes over a timescale of about one year. Our observations are consistent with a system observed at a large inclination angle (I ≳ 60°). The derived circumstellar disk size shows that the disk evolves from a configuration that prevents accretion onto the neutron star, to one that allows only moderate accretion. This is in agreement with the contemporary observed X-ray activity. Our results are interpreted within the context of inefficient tidal truncation of the circumstellar disk, as expected for this source's binary configuration. We derived the Hβ-emitting region size, which is equal to about half of the corresponding Hα-emitting disk, and constrain the luminosity class of V850 Cen as III-V, consistent with the previously proposed class.

Soft X-ray resonant scattering from magnetic heterostructures

International Nuclear Information System (INIS)

Grabis, J.

2005-01-01

Heterogenous magnetic multilayers are of great interest both because of their relevance for technological applications and since they provide model systems to understand magnetic behavior and interactions. Soft x-ray resonant magnetic scattering (XRMS) allows to determine element-specific and depth-resolving information of the local magnetic order of such systems. Within the framework of the present thesis the diffractometer ALICE for soft XRMS has been constructed. XRMS measurements of two different physical systems are presented in this thesis: The antiferromagnetic and ferromagnetic order in interlayer exchange-coupled Fe/Cr(001) superlattices are studied as a function of the applied field by measuring the reflected intensity at different positions in reciprocal space. Thin films and multilayers of the Heusler compound Co 2 MnGe are studied by means of soft x-ray absorption spectroscopy, magnetic circular dichroism and resonant magnetic scattering

The x-ray laser as a tool for imaging plasmas

International Nuclear Information System (INIS)

Libby, S.B.; Da Silva, L.B.; Barbee, T.W. Jr.

1995-07-01

The x-ray laser is now being used at LLNL as a tool for measuring the behaviors of hot dense plasmas. In particular, we have used the 155 Angstrom yttrium laser to study transient plasmas by both radiography and moire deflectrometry. These techniques have been used to probe long scale length plasmas at electron densities exceeding 10 22 cm -3 . Recent advances in multilayer technology have made it possible to directly image ion densities in directly driven thin foils to an accuracy of 1--2 μm. In addition, we have constructed an x-ray laser Mach-Zehnder interferometer using multilayer beam-splitters. This interferometer yields direct 2D projections of electron densities in plasmas with micron spatial resolution. In addition, this interferometer can be used to measure spectral line shapes to high accuracy. Among the subject plasmas under study are laser irradiated planar targets, gold hohlraums, and x-ray lasers themselves

Pulse-periodic generation of supershort avalanche electron beams and X-ray emission

Science.gov (United States)

Baksht, E. Kh.; Burachenko, A. G.; Erofeev, M. V.; Tarasenko, V. F.

2014-05-01

Pulse-periodic generation of supershort avalanche electron beams (SAEBs) and X-ray emission in nitrogen, as well as the transition from a single-pulse mode to a pulse-periodic mode with a high repetition frequency, was studied experimentally. It is shown that, in the pulse-periodic mode, the full width at halfmaximum of the SAEB is larger and the decrease rate of the gap voltage is lower than those in the single-pulse mode. It is found that, when the front duration of the voltage pulse at a nitrogen pressure of 90 Torr decreases from 2.5 to 0.3 ns, the X-ray exposure dose in the pulse-periodic mode increases by more than one order of magnitude and the number of SAEB electrons also increases. It is shown that, in the pulse-periodic mode of a diffuse discharge, gas heating in the discharge gap results in a severalfold increase in the SAEB amplitude (the number of electrons in the beam). At a generator voltage of 25 kV, nitrogen pressure of 90 Torr, and pulse repetition frequency of 3.5 kHz, a runaway electron beam was detected behind the anode foil.

Adjustment of a low energy, X-rays generator (6 kV - 50 mA). Application to X-rays detectors calibration

International Nuclear Information System (INIS)

Legistre, C.

1995-02-01

The aim of this memoir is the calibration of an aluminium photocathode X-rays photoelectric detector, in the spectral range 0,5 keV - 1,5 KeV, with a continuous X-ray source. The detectors's calibration consist to measure the detector's sensitivity versus incident energy. In order to produce monochromatic incident beam on the detector, we used a multilayer mirror whose reflectivity was characterized. The measurements are compared to those realized in an other laboratory. (authors). 36 refs., 61 figs., 13 tabs., 2 photos

Transient periodic x-ray source in Taurus, A0535+26

International Nuclear Information System (INIS)

Bradt, H.; Mayer, W.; Buff, J.; Clark, G.W.; Doxsey, R.; Hearn, D.; Jernigan, G.; Joss, P.C.; Laufer, B.; Lewin, W.; Li, F.; Matilsky, T.; McClintock, J.; Primini, F.; Rappaport, S.; Schnopper, H.

1976-01-01

Light curves of the 104 s periodicity in the transient X-ray source in Taurus (A0535+26) are presented for six energy intervals in the range 1-35 keV for the period 1975 May 30-June 2. The pulse structure ranges from an apparently simple modulation at higher energies to a very complex pattern at lower energies. No Doppler shift is observed in the 104 s pulse period during the three days of observations. This places severe constraints upon possible binary orbital motion. Upper limits on the power at other periodicities are approximately-less-than10 percent for 2 ms-2s and approximately-less-than2 percent for 2 s-2000 s

Null Lens Assembly for X-Ray Mirror Segments

Science.gov (United States)

Robinson, David W.

2011-01-01

A document discusses a null lens assembly that allows laser interferometry of 60 deg. slumped glass mirror segments used in x-ray mirrors. The assembly consists of four lenses in precise alignment to each other, with incorporated piezoelectric nanometer stepping actuators to position the lenses in six degrees of freedom for positioning relative to each other.

Soft X-ray Foucault test: A path to diffraction-limited imaging

Science.gov (United States)

Ray-Chaudhuri, A. K.; Ng, W.; Liang, S.; Cerrina, F.

1994-08-01

We present the development of a soft X-ray Foucault test capable of characterizing the imaging properties of a soft X-ray optical system at its operational wavelength and its operational configuration. This optical test enables direct visual inspection of imaging aberrations and provides real-time feedback for the alignment of high resolution soft X-ray optical systems. A first application of this optical test was carried out on a Mo-Si multilayer-coated Schwarzschild objective as part of the MAXIMUM project. Results from the alignment procedure are presented as well as the possibility for testing in the hard X-ray regime.

X ray spectra of X Per. [oso-8 observations

Science.gov (United States)

Becker, R. H.; Boldt, E. A.; Holt, S. S.; Pravdo, S. H.; Robinson-Saba, J.; Serlemitsos, P. J.; Swank, J. H.

1978-01-01

The cosmic X-ray spectroscopy experiment on OSO-8 observed X Per for twenty days during two observations in Feb. 1976 and Feb. 1977. The spectrum of X Per varies in phase with its 13.9 min period, hardening significantly at X-ray minimum. Unlike other X-ray binary pulsar spectra, X Per's spectra do not exhibit iron line emission or strong absorption features. The data show no evidence for a 22 hour periodicity in the X-ray intensity of X Per. These results indicate that the X-ray emission from X Per may be originating from a neutron star in a low density region far from the optically identified Be star.

Nanometer-scale, quantitative composition mappings of InGaN layers from a combination of scanning transmission electron microscopy and energy dispersive x-ray spectroscopy

International Nuclear Information System (INIS)

Pantzas, K; Voss, P L; Ougazzaden, A; Patriarche, G; Largeau, L; Mauguin, O; Troadec, D; Gautier, S; Moudakir, T; Suresh, S

2012-01-01

Using elastic scattering theory we show that a small set of energy dispersive x-ray spectroscopy (EDX) measurements is sufficient to experimentally evaluate the scattering function of electrons in high-angle annular dark field scanning transmission microscopy (HAADF-STEM). We then demonstrate how to use this function to transform qualitative HAADF-STEM images of InGaN layers into precise, quantitative chemical maps of the indium composition. The maps obtained in this way combine the resolution of HAADF-STEM and the chemical precision of EDX. We illustrate the potential of such chemical maps by using them to investigate nanometer-scale fluctuations in the indium composition and their impact on the growth of epitaxial InGaN layers. (paper)

The nuclear spectroscopic telescope array (NuSTAR) high-energy X-ray mission

DEFF Research Database (Denmark)

Madsen, Kristin K.; Harrison, Fiona A.; Hongjun An

2014-01-01

The Nuclear Spectroscopic Telescope Array (NuSTAR) mission was launched on 2012 June 13 and is the first focusing high-energy X-ray telescope in orbit operating above ~10 keV. NuSTAR flies two co-aligned Wolter-I conical approximation X-ray optics, coated with Pt/C and W/Si multilayers...

X-ray characterization of Au-free grown GaAs nanowires on Si

Energy Technology Data Exchange (ETDEWEB)

Biermanns, Andreas; Davydok, Anton; Pietsch, Ullrich [Universitaet Siegen, Festkoerperphysik (Germany); Breuer, Steffen; Geelhaar, Lutz [Paul-Drude-Institut fuer Festkoerperelektronik, Berlin (Germany)

2011-07-01

Semiconductor nanowires (NW) are of particular interest due to the ability to synthesize single-crystalline 1D epitaxial structures and heterostructures in the nanometer range. However, many details of the growth mechanism are not well understood. In this contribution we present a x-ray diffraction study of the early stage of Au-free GaAs nanowire growth on Si(111)-substrates with native oxide using the nano-focus setup available at the ID1 beamline of ESRF. The GaAs NWs were grown by molecular beam epitaxy (MBE), and their formation was induced by Ga droplets. Using a nanometer-sized x-ray beam, size and lattice parameters of individual wires were measured separately. Using asymmetric x-ray diffraction on particular zinc-blende (ZB) and wurtzite (W) sensitive reflections, we show that under the used conditions the NW growth starts with predominantly WZ phases and continues mainly in ZB phase. In addition we can show that the WZ segments of the NWs exhibit a different vertical lattice parameter compared to the zinc-blende segments. A combination of x-ray diffraction from single wires and grazing incidence diffraction shows that the base of the NW is compressively strained along the inplane direction. This strain is released within 20 nm from the substrate-interface.

Infrared, radio, and x-ray observations of Cygnus X-3

International Nuclear Information System (INIS)

Becklin, E.E.; Hawkins, F.J.; Mason, K.O.; Matthews, K.; Neugebauer, G.; Packman, D.; Sanford, P.W.; Schupler, B.; Stark, A.; Wynn-Williams, C.G.

1974-01-01

The x-ray source Cygnus X-3 has been interpreted as being a binary system on the basis of extensive x-ray observations of periodic variability. At radio wavelengths, the source displays erratic outbursts. Cyg x-3 has not been detected visually but at infrared wavelengths periodic variations in phase with the x-ray variations have been reported. Infrared, x-ray and radio observations of Cyg X-3 made during 1973 through 1973 October are presented. (U.S.)

X-ray fluorescence microtomography analyzing prostate tissues

International Nuclear Information System (INIS)

Pereira, Gabriela R.; Rocha, Henrique S.; Calza, Cristiane; Lopes, Ricardo T.

2009-01-01

The objective of this work is to determine the elemental distribution map in reference samples and prostate tissue samples using X-Ray Fluorescence Microtomography (XRFCT) in order to verify concentrations of certain elements correlated with characteristics observed by the transmission microtomography. The experiments were performed at the X-Ray Fluorescence Facility of the Brazilian Synchrotron Light Laboratory. A quasi-monochromatic beam produced by a multilayer monochromator was used as an incident beam. The transmission CT images were reconstructed using filtered-back-projection algorithm, and the XRFCT images were reconstructed using filtered-back-projection algorithm with absorption corrections. (author)

Utilization of plastics as transparent x-ray filter

International Nuclear Information System (INIS)

Masuda, Yathuhiko; Inui, Saburo; Kooda, Kazunao; Takiguchi, Kiyomi; Abe, Yoshinobu.

1980-01-01

An attempt has been made to develop heavy atom containing transparent plastic filters which are identical with conventional aluminum or copper filters in X-ray attenuating property. These transparent filters can be used as fixed at the front of a conventional multilayer collimator without obstructing the optical detection of the field size of X-ray exposure. It has become a serious problem that recent increasing use of X-ray in diagnostics, namely increasing patient exposure, may cause baneful influence upon the patients. To reduce such patient exposure, the I.C.R.P. has recommended the proper use of metal filters made of aluminum or copper with regards to the applied tube potential. These filters are generally used as fixed at the X-ray tube window or used at the front of a multilayer collimator as added filters. In the former case, and exchange of filters to select the best one with regards to the applied tube potential needs complicated works, and in the latter, the use of the added filters also needs complicated works to confirm field size before each radiography. These troublesome works have at time resulted in improper uses of the filters although the effective selection of filters is known to be useful to the reduction of patient exposure. Therefore, the problem of reduction of patient exposure by means of filtration still remains practically unsolved. To offer practical added filters which do not possess above mentioned disadvantages of metal filters, we tried to develop transparent added filters. Transparent plastics as the material of the filters were loaded with heavy atoms to equalize X-ray attenuating property with aluminum or copper. (author)

Dynamics of a multiple-pulse-driven x-ray laser plasma

International Nuclear Information System (INIS)

Wan, A.S.; Da Silva, L.B.; Moreno, J.C.; Cauble, R.; Celliers, P.; Dalhed, H.E. Jr.; Koch, J.A.; Nilsen, J.

1996-01-01

In this paper we describe experimental and computational studies of multiple-pulse-driven laser plasma, which is the gain medium for a neon-like yttrium x-ray laser. Near-field emission profiles have been measured both with and without reinjection of the x-ray laser photons to couple with the amplifying medium created by later pulses using an external multilayer mirror. From the temporal and spatial evolution of the near-field emission profiles we can examine the pulse-to-pulse variation of the x-ray laser plasma due to changes in the hydrodynamics, laser deposition, and the injecting of x-ray laser photons back into an amplifying x-ray laser plasma. Using a combination of radiation hydrodynamics, atomic kinetics, and ray propagation codes, reasonable agreement has been obtained between simulations and the experimental results. copyright 1996 American Institute of Physics

X-ray lenses with large aperture

International Nuclear Information System (INIS)

Simon, Markus

2010-01-01

Up to now, most X-ray imaging setups are based on absorption contrast imaging. There is a demand for focused X-rays in many X-ray analysis applications, either to increase the resolution of an imaging system, or, to reduce the time effort of an experiment through higher photon flux. For photon energies higher than 15 keV refractive X-ray optics are more efficient in comparison to non-refractive X-ray optics. The aim of this work was to develop X-ray lenses with large apertures and high transparency. By increasing the number of refracting surfaces while removing unnecessary lens material such lenses have been developed. Utilizing this approach the overall beam deflection angle is large with respect to the lens material it propagates through and so the transparency of the lens is increased. Within this work, X-ray lenses consisting of several thousands of prisms with an edge length in the range of micrometers have been developed and fabricated by deep X-ray lithography. Deep X-ray lithography enables high precision microstrucures with smooth sidewalls and large aspect ratios. The aperture of high-transparency X-ray lenses made this way is greater than 1 mm. They are suitable for photon energies in the range of 8 keV to 24 keV and offer a focal width of smaller than 10 μm at a transparency of around 40%. Furthermore, rolled X-ray lenses have been developed, that are made out of a microstructured polyimide film, which is cut according to the requirements regarding focal length and photon energy. The microstructured film is fabricated by molding, using an anisotropically etched silicon wafer as molding tool. Its mean roughness is in the range of nanometers. The film features prismatic structures, its surface topology is similar to an asparagus field. The measured diameter of the point focus was 18 μm to 31 μm, the calculated opticla efficiency was 37%. Future work will concentrate on increasing the aspect ratio of Prism Lenses and on increasing the rolling accuracy

Subgroup report on hard x-ray microprobes

International Nuclear Information System (INIS)

Ice, G.E.; Barbee, T.; Bionta, R.; Howells, M.; Thompson, A.C.; Yun, W.

1994-01-01

The increasing availability of synchrotron x-ray sources has stimulated the development of advanced hard x-ray (E≥5 keV) microprobes. New x-ray optics have been demonstrated which show promise for achieving intense submicron hard x-ray probes. These probes will be used for extraordinary elemental detection by x-ray fluorescence/absorption and for microdiffraction to identify phase and strain. The inherent elemental and crystallographic sensitivity of an x-ray microprobe and its inherently nondestructive and penetrating nature makes the development of an advanced hard x-ray microprobe an important national goal. In this workshop state-of-the-art hard x-ray microprobe optics were described and future directions were discussed. Gene Ice, Oak Ridge National Laboratory (ORNL), presented an overview of the current status of hard x-ray microprobe optics and described the use of crystal spectrometers to improve minimum detectable limits in fluorescent microprobe experiments. Al Thompson, Lawrence Berkeley Laboratory (LBL), described work at the Center for X-ray Optics to develop a hard x-ray microprobe based on Kirkpatrick-Baez (KB) optics. Al Thompson also showed the results of some experimental measurements with their KB optics. Malcolm Howells presented a method for bending elliptical mirrors and Troy Barbee commented on the use of graded d spacings to achieve highest efficiency in KB multilayer microfocusing. Richard Bionta, Lawrence Livermore National Laboratory (LLNL), described the development of the first hard x-ray zone plates and future promise of so called open-quotes jelly rollclose quotes or sputter slice zone plates. Wenbing Yun, Argonne National Laboratory (ANL), described characterization of jelly roll and lithographically produced zone plates and described the application of zone plates to focus extremely narrow bandwidths by nuclear resonance. This report summarizes the presentations of the workshop subgroup on hard x-ray microprobes

Wedged multilayer Laue lens

International Nuclear Information System (INIS)

Conley, Ray; Liu Chian; Qian Jun; Kewish, Cameron M.; Macrander, Albert T.; Yan Hanfei; Maser, Joerg; Kang, Hyon Chol; Stephenson, G. Brian

2008-01-01

A multilayer Laue lens (MLL) is an x-ray focusing optic fabricated from a multilayer structure consisting of thousands of layers of two different materials produced by thin-film deposition. The sequence of layer thicknesses is controlled to satisfy the Fresnel zone plate law and the multilayer is sectioned to form the optic. An improved MLL geometry can be created by growing each layer with an in-plane thickness gradient to form a wedge, so that every interface makes the correct angle with the incident beam for symmetric Bragg diffraction. The ultimate hard x-ray focusing performance of a wedged MLL has been predicted to be significantly better than that of a nonwedged MLL, giving subnanometer resolution with high efficiency. Here, we describe a method to deposit the multilayer structure needed for an ideal wedged MLL and report our initial deposition results to produce these structures

X-ray microfocusing with off-axis ellipsoidal mirror

Energy Technology Data Exchange (ETDEWEB)

Yumoto, Hirokatsu, E-mail: yumoto@spring8.or.jp; Koyama, Takahisa [Japan Synchrotron Radiation Research Institute/SPring-8, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198 (Japan); Matsuyama, Satoshi; Yamauchi, Kazuto [Department of Precision Science and Technology, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871 (Japan); Kohmura, Yoshiki; Ishikawa, Tetsuya [RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5148 (Japan); Ohashi, Haruhiko [Japan Synchrotron Radiation Research Institute/SPring-8, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198 (Japan); RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5148 (Japan)

2016-07-27

High-precision ellipsoidal mirrors for two-dimensionally focusing X-rays to nanometer sizes have not been realized because of technical problems in their fabrication processes. The objective of the present study is to develop fabrication techniques for ellipsoidal focusing mirrors in the hard-X-ray region. We design an off-axis ellipsoidal mirror for use under total reflection conditions up to the X-ray energy of 8 keV. We fabricate an ellipsoidal mirror with a surface roughness of 0.3 nm RMS (root-mean-square) and a surface figure error height of 3.0 nm RMS by utilizing a surface profiler and surface finishing method developed by us. The focusing properties of the mirror are evaluated at the BL29XUL beamline in SPring-8. A focusing beam size of 270 nm × 360 nm FWHM (full width at half maximum) at an X-ray energy of 7 keV is observed with the use of the knife-edge scanning method. We expect to apply the developed fabrication techniques to construct ellipsoidal nanofocusing mirrors.

Magnetic x-ray dichroism in ultrathin epitaxial films

Energy Technology Data Exchange (ETDEWEB)

Tobin, J.G.; Goodman, K.W. [Lawrence Berkeley National Lab., CA (United States); Cummins, T.R. [Univ. of Missouri, Rolla, MO (United States)] [and others

1997-04-01

The authors have used Magnetic X-ray Linear Dichroism (MXLD) and Magnetic X-ray Circular Dichroism (MXCD) to study the magnetic properties of epitaxial overlayers in an elementally specific fashion. Both MXLD and MXCD Photoelectron Spectroscopy were performed in a high resolution mode at the Spectromicroscopy Facility of the ALS. Circular Polarization was obtained via the utilization of a novel phase retarder (soft x-ray quarter wave plate) based upon transmission through a multilayer film. The samples were low temperature Fe overlayers, magnetic alloy films of NiFe and CoNi, and Gd grown on Y. The authors results include a direct comparison of high resolution angle resolved Photoelectron Spectroscopy performed in MXLD and MXCD modes as well as structural studies with photoelectron diffraction.

Magnetic x-ray dichroism in ultrathin epitaxial films

International Nuclear Information System (INIS)

Tobin, J.G.; Goodman, K.W.; Cummins, T.R.

1997-01-01

The authors have used Magnetic X-ray Linear Dichroism (MXLD) and Magnetic X-ray Circular Dichroism (MXCD) to study the magnetic properties of epitaxial overlayers in an elementally specific fashion. Both MXLD and MXCD Photoelectron Spectroscopy were performed in a high resolution mode at the Spectromicroscopy Facility of the ALS. Circular Polarization was obtained via the utilization of a novel phase retarder (soft x-ray quarter wave plate) based upon transmission through a multilayer film. The samples were low temperature Fe overlayers, magnetic alloy films of NiFe and CoNi, and Gd grown on Y. The authors results include a direct comparison of high resolution angle resolved Photoelectron Spectroscopy performed in MXLD and MXCD modes as well as structural studies with photoelectron diffraction

Structure determination of a multilayer with an island-like overlayer using hard x-ray photoelectron spectroscopy

Energy Technology Data Exchange (ETDEWEB)

Isomura, N., E-mail: isomura@mosk.tytlabs.co.jp; Kataoka, K.; Horibuchi, K.; Dohmae, K.; Kitazumi, K.; Takahashi, N.; Kimoto, Y. [Toyota Central R& D Laboratories, Inc., 41-1 Yokomichi, Nagakute, Aichi 480-1192 (Japan); Oji, H.; Cui, Y.-T.; Son, J.-Y. [Japan Synchrotron Radiation Research Institute (JASRI), 1-1-1 Kouto, Sayo, Hyogo 679-5198 (Japan)

2016-07-27

We use hard X-ray photoelectron spectroscopy (HAXPES) to obtain the surface structure of a multilayer Au/SiO{sub 2}/Si substrate sample with an island-like overlayer. Photoelectron intensities are measured as a function of incident photon energy (PE) and take-off angle (TOA, measured from the sample surface). The Au layer coverage and Au and SiO{sub 2} layer thicknesses are obtained by the PE dependence, and are used for the following TOA analysis. The Au island lateral width in the cross section is obtained by the TOA dependence, including information about surface roughness, in consideration of the island shadowing at small TOAs. In both cases, curve-fitting analysis is conducted. The surface structure, which consists of layer thicknesses, overlayer coverage and island width, is determined nondestructively by a combination of PE and TOA dependent HAXPES measurements.

Quantitative x-ray photoelectron spectroscopy: Simple algorithm to determine the amount of atoms in the outermost few nanometers

International Nuclear Information System (INIS)

Tougaard, Sven

2003-01-01

It is well known that due to inelastic electron scattering, the measured x-ray photoelectron spectroscopy peak intensity depends strongly on the in-depth atom distribution. Quantification based only on the peak intensity can therefore give large errors. The problem was basically solved by developing algorithms for the detailed analysis of the energy distribution of emitted electrons. These algorithms have been extensively tested experimentally and found to be able to determine the depth distribution of atoms with nanometer resolution. Practical application of these algorithms has increased after ready-to-use software packages were made available and they are now being used in laboratories worldwide. These software packages are easy to use but they need operator interaction. They are not well suited for automatic data processing and there is an additional need for simplified quantification strategies that can be automated. In this article we report on a very simple algorithm. It is a slightly more accurate version of our previous algorithm. The algorithm gives the amount of atoms within the outermost three inelastic mean free paths and it also gives a rough estimate for the in-depth distribution. An experimental example of its application is also presented

An x-ray microprobe using focussing optics with a synchrotron radiation source

International Nuclear Information System (INIS)

Thompson, A.C.; Underwood, J.H.; Wu, Y.; Giauque, R.D.

1989-01-01

An x-ray microprobe can be used to produce maps of the concentration of elements in a sample. Synchrotron radiation provides x-ray beams with enough intensity and collimation to make possible elemental images with femtogram sensitivity. The use of focussing x-ray mirrors made from synthetic multilayers with a synchrotron x-ray beam allows beam spot sizes of less than 10 μm /times/ 10 μm to be produced. Since minimal sample preparation is required and a vacuum environment is not necessary, there will be a wide variety of applications for such microprobes. 8 refs., 6 figs

X-ray magnetic microscopy for correlations between magnetic domains and crystal structure

International Nuclear Information System (INIS)

Denbeaux, G.; Anderson, E.; Bates, B.; Chao, W.; Liddle, J.A.; Harteneck, B.; Pearson, A.; Salmassi, F.; Schneider, G.; Fischer, P.; Eimuller, T.; Taylor, S.; Chang, H.; Kusinski, G.J.

2002-01-01

Accurately determining the resolution of x-ray microscopes has been a challenge because good test patterns for x-ray microscopy have been hard to make. We report on a sputter-deposited multilayer imaged in cross section as a test pattern with small features and high aspect ratios. One application of high-resolution imaging is magnetic materials. Off-axis bend magnet radiation is known to have a component of circular polarization which can be used for x-ray magnetic circular dichroism. We calculate the integrated circular polarization collected by the illumination optics in the XM-1 full-field x-ray microscope. (authors)

Multi-Layer Organic Squaraine-Based Photodiode for Indirect X-Ray Detection

Science.gov (United States)

Iacchetti, Antonio; Binda, Maddalena; Natali, Dario; Giussani, Mattia; Beverina, Luca; Fiorini, Carlo; Peloso, Roberta; Sampietro, Marco

2012-10-01

The paper presents an organic-based photodiode coupled to a CsI(Tl) scintillator to realize an X-ray detector. A suitable blend of an indolic squaraine derivative and of fullerene derivative has been used for the photodiode, thus allowing external quantum efficiency in excess of 10% at a wavelength of 570 nm, well matching the scintillator output spectrum. Thanks to the additional deposition of a 15 nm thin layer of a suitable low electron affinity polymer, carriers injection from the metal into the organic semiconductor has been suppressed, and dark current density as low as has been obtained, which is comparable to standard Si-based photodiodes. By using a collimated X-ray beam impinging onto the scintillator mounted over the photodiode we have been able to measure current variations in the order of 150 pA on a dark current floor of less than 50 pA when operating the X-ray tube in switching mode, thus proving the feasibility of indirect X-ray detection by means of organic semiconductors.

Using Dark Field X-Ray Microscopy To Study In-Operando Yttria Stabilized Zirconia Electrolyte Supported Solid Oxide Cell

DEFF Research Database (Denmark)

Sierra, J. X.; Poulsen, H. F.; Jørgensen, P. S.

Dark Field X-Ray Microscopy is a promising technique to study the structure of materials in nanometer length scale. In combination with x-ray diffraction technique, the microstructure evolution of Yttria Stabilized Zirconia electrolyte based solid oxide cell was studied running at extreme operating...

Possibilities and Challenges of Scanning Hard X-ray Spectro-microscopy Techniques in Material Sciences

Directory of Open Access Journals (Sweden)

Andrea Somogyi

2015-06-01

Full Text Available Scanning hard X-ray spectro-microscopic imaging opens unprecedented possibilities in the study of inhomogeneous samples at different length-scales. It gives insight into the spatial variation of the major and minor components, impurities and dopants of the sample, and their chemical and electronic states at micro- and nano-meter scales. Measuring, modelling and understanding novel properties of laterally confined structures are now attainable. The large penetration depth of hard X-rays (several keV to several 10 keV beam energy makes the study of layered and buried structures possible also in in situ and in operando conditions. The combination of different X-ray analytical techniques complementary to scanning spectro-microscopy, such as X-ray diffraction, X-ray excited optical luminescence, secondary ion mass spectrometry (SIMS and nano-SIMS, provides access to optical characteristics and strain and stress distributions. Complex sample environments (temperature, pressure, controlled atmosphere/vacuum, chemical environment are also possible and were demonstrated, and allow as well the combination with other analysis techniques (Raman spectroscopy, infrared imaging, mechanical tensile devices, etc. on precisely the very same area of the sample. The use of the coherence properties of X-rays from synchrotron sources is triggering emerging experimental imaging approaches with nanometer lateral resolution. New fast analytical possibilities pave the way towards statistically significant studies at multi- length-scales and three dimensional tomographic investigations. This paper gives an overview of these techniques and their recent achievements in the field of material sciences.

Design studies for ITER x-ray diagnostics

International Nuclear Information System (INIS)

Hill, K.W.; Bitter, M.; von Goeler, S.; Hsuan, H.

1995-01-01

Concepts for adapting conventional tokamak x-ray diagnostics to the harsh radiation environment of ITER include use of grazing-incidence (GI) x-ray mirrors or man-made Bragg multilayer (ML) elements to remove the x-ray beam from the neutron beam, or use of bundles of glass-capillary x-ray ''light pipes'' embedded in radiation shields to reduce the neutron/gamma-ray fluxes onto the detectors while maintaining usable x-ray throughput. The x-ray optical element with the broadest bandwidth and highest throughput, the GI mirror, can provide adequate lateral deflection (10 cm for a deflected-path length of 8 m) at x-ray energies up to 12, 22, or 30 keV for one, two, or three deflections, respectively. This element can be used with the broad band, high intensity x-ray imaging system (XIS), the pulseheight analysis (PHA) survey spectrometer, or the high resolution Johann x-ray crystal spectrometer (XCS), which is used for ion-temperature measurement. The ML mirrors can isolate the detector from the neutron beam with a single deflection for energies up to 50 keV, but have much narrower bandwidth and lower x-ray power throughput than do the GI mirrors; they are unsuitable for use with the XIS or PHA, but they could be used with the XCS; in particular, these deflectors could be used between ITER and the biological shield to avoid direct plasma neutron streaming through the biological shield. Graded-d ML mirrors have good reflectivity from 20 to 70 keV, but still at grazing angles (<3 mrad). The efficiency at 70 keV for double reflection (10 percent), as required for adequate separation of the x-ray and neutron beams, is high enough for PHA requirements, but not for the XIS. Further optimization may be possible

X-ray laser interferometry: A new tool for AGEX

International Nuclear Information System (INIS)

Wan, A.S.; Moreno, J.C.; Libby, S.B.

1995-10-01

Collisionally pumped soft x-ray lasers now operate over a wavelength range extending from 4--40 nm. With the recent advances in the development of multilayer mirrors and beamsplitters in the soft x-ray regime, we can utilize the unique properties of x-ray lasers to study large, rapidly evolving laser-driven plasmas with high electron densities. By employing a shorter wavelength x-ray laser, as compared to using conventional optical laser as the probe source, we can access a much higher density regime while reducing refractive effects which limit the spatial resolution and data interpretation. Using a neon-like yttrium x-ray laser which operates at a wavelength of 15.5 mn, we have performed a series of soft x-ray laser interferometry experiments, operated in the skewed Mach-Zehnder configuration, to characterize plasmas relevant to both weapons and inertial confinement fusion. The two-dimensional density profiles obtained from the interferograms allow us to validate and benchmark our numerical models used to study the physics in the high-energy density regime, relevant to both weapons and inertial confinement fusion

Design of an imaging microscope for soft X-ray applications

Science.gov (United States)

Hoover, Richard B.; Shealy, David L.; Gabardi, David R.; Walker, Arthur B. C., Jr.; Lindblom, Joakim F.

1988-01-01

An imaging soft X-ray microscope with a spatial resolution of 0.1 micron and normal incidence multilayer optics is discussed. The microscope has a Schwarzschild configuration, which consists of two concentric spherical mirrors with radii of curvature which minimize third-order spherical aberration, coma, and astigmatism. The performance of the Stanford/MSFC Cassegrain X-ray telescope and its relevance to the present microscope are addressed. A ray tracing analysis of the optical system indicates that diffraction-limited performance can be expected for an object height of 0.2 mm.

Determination of superlattice effect on metal–ceramic nano-structures

Directory of Open Access Journals (Sweden)

J.C. Caicedo

2015-01-01

Full Text Available Binary nitrides multilayer systems were grown on silicon (100 substrates with the aim to study the coherent assembly in HfN/VN material. Multilayers films were grown via reactive r.f. magnetron sputtering technique by systematically varying the bilayer period (Λ and the bilayer number (n while maintaining constant the total coating thickness (∼2.4 μm. The layers were characterized by high angle X-ray diffraction (HA-XRD, low angle X-ray diffraction (LA-XRD. HfN and VN layers were analyzed by X-ray photoelectron spectroscopy (XPS and electron and transmission microscopy (TEM. HA-XRD results showed preferential growth in the face-centered cubic (111 crystal structure for HfN/VN multilayer systems with the epitaxial relation (111 [100]HfN//(200 [100]VN. The maximum coherent assembly was observed with presence of satellite peaks. With this idea, ternary and binary nitrides films have been designed and deposited on Si (100 substrates with bilayer periods (Λ in a broad range, from nanometers to micrometers. The films were fabricated to study the structural evolution, coherent assembly progress and optical properties such as the critical angle, dispersion coefficient, index of refraction for HfN/VN multilayers with decreasing bilayer thickness.

Soft X-ray images of the solar corona using normal incidence optics

Science.gov (United States)

Bruner, M. E.; Haisch, B. M.; Brown, W. A.; Acton, L. W.; Underwood, J. H.

1988-01-01

A solar coronal loop system has been photographed in soft X-rays using a normal incidence telescope based on multilayer mirror technology. The telescope consisted of a spherical objective mirror of 4 cm aperture and 1 m focal length, a film cassette, and a focal plane shutter. A metallized thin plastic film filter was used to exclude visible light. The objective mirror was covered with a multilayer coating consisting of alternating layers of tungsten and carbon whose combined thicknesses satisfied the Bragg diffraction condition for 44 A radiation. The image was recorded during a rocket flight on October 25, 1985 and was dominated by emission lines arising from the Si XII spectrum. The rocket also carried a high resolution soft X-ray spectrograph that confirmed the presence of Si XII line radiation in the source. This image represents the first successful use of multilayer technology for astrophysical observations.

Formation of oriented membrane multilayers of Na/K-ATPase

International Nuclear Information System (INIS)

Pachence, J.M.; Knott, R.; Edelman, I.S.; Schoenborn, B.P.; Wallace, B.A.

1982-01-01

The isolated membrane-bound enzyme retains its ouabain-sensitive ATP hydrolysis activity, and produces ATP-dependent Na + and K + fluxes when incorporated into phospholipid vesicles. The ultimate goal of this work is to determine its low resolution structure using both X-ray and neutron diffraction. A number of methods were used to impart lamellar stacking order to highly purified pig Na/K-ATPase membranes. Upon partial dehydration, x-ray diffraction from Na/K-ATPase membrane multilayers at 98% relative humidity yielded discrete reflections of 118 A periodicity, diffracting to 1/14.8 A -1 , additionally, continuous diffraction to 1/10 A -1 was obtained. Subjecting the membrane multilayers to high magnetic fields improved the quality of the lamellar diffraction dramatically. Neutron diffraction studies of the partially dehydrated Na/K-ATPase membrane multilayers detected a mosaic spread of 2 0 when the samples were subjected to a magnetic field of 5 Tesla perpendicular to the membrane surface; the reflections were narrower than the camera line width; hence, the lattice disorder has also decreased significantly, although only four orders were measured

Random On-Board Pixel Sampling (ROPS) X-Ray Camera

Energy Technology Data Exchange (ETDEWEB)

Wang, Zhehui [Los Alamos; Iaroshenko, O. [Los Alamos; Li, S. [Los Alamos; Liu, T. [Fermilab; Parab, N. [Argonne (main); Chen, W. W. [Purdue U.; Chu, P. [Los Alamos; Kenyon, G. [Los Alamos; Lipton, R. [Fermilab; Sun, K.-X. [Nevada U., Las Vegas

2017-09-25

Recent advances in compressed sensing theory and algorithms offer new possibilities for high-speed X-ray camera design. In many CMOS cameras, each pixel has an independent on-board circuit that includes an amplifier, noise rejection, signal shaper, an analog-to-digital converter (ADC), and optional in-pixel storage. When X-ray images are sparse, i.e., when one of the following cases is true: (a.) The number of pixels with true X-ray hits is much smaller than the total number of pixels; (b.) The X-ray information is redundant; or (c.) Some prior knowledge about the X-ray images exists, sparse sampling may be allowed. Here we first illustrate the feasibility of random on-board pixel sampling (ROPS) using an existing set of X-ray images, followed by a discussion about signal to noise as a function of pixel size. Next, we describe a possible circuit architecture to achieve random pixel access and in-pixel storage. The combination of a multilayer architecture, sparse on-chip sampling, and computational image techniques, is expected to facilitate the development and applications of high-speed X-ray camera technology.

Design and characterization for absolute x-ray spectrometry in the 100-10,000 eV region

International Nuclear Information System (INIS)

Henke, B.L.

1986-08-01

Reviewed here are the design and characterization procedures used in our program for developing absolute x-ray spectrometry in the 100 to 10,000 eV region. Described are the selection and experimental calibration of the x-ray filters, mirror momochromators, crystal/multilayer analyzers, and the photographic (time integrating) and photoelectric (time resolving) position-sensitive detectors. Analytical response functions have been derived that characterize the energy dependence of the mirror and crystal/multilayer reflectivities and of the photographic film and photocathode sensitivities. These response functions permit rapid, small-computer reduction of the experimental spectra to absolute spectra (measured in photons per stearadian from the source for radiative transitions at indicated photon energies). Our x-ray spectrographic systems are being applied to the diagnostics of pulsed, high temperature plasma sources in laser fusion and x-ray laser research. 15 refs., 27 figs

Formation of x-ray Newton’s rings from nano-scale spallation shells of metals in laser ablation

Directory of Open Access Journals (Sweden)

Masaharu Nishikino

2017-01-01

Full Text Available The initial stages of the femtosecond (fs laser ablation process of gold, platinum, and tungsten were observed by single-shot soft x-ray imaging technique. The formation and evolution of soft x-ray Newton’s rings (NRs were found for the first time. The soft x-ray NRs are caused by the interference between the bulk ablated surface and nanometer-scale thin spallation layer; they originate from the metal surface at pump energy fluence of around 1 J/cm2 and work as a flying soft x-ray beam splitter.

Lasers, extreme UV and soft X-ray

Energy Technology Data Exchange (ETDEWEB)

Nilsen, Joseph [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)

2015-09-20

Three decades ago, large ICF lasers that occupied entire buildings were used as the energy sources to drive the first X-ray lasers. Today X-ray lasers are tabletop, spatially coherent, high-repetition rate lasers that enable many of the standard optical techniques such as interferometry to be extended to the soft X-ray regime between wavelengths of 10 and 50 nm. Over the last decade X-ray laser performance has been improved by the use of the grazing incidence geometry, diode-pumped solid-state lasers, and seeding techniques. The dominant X-ray laser schemes are the monopole collisional excitation lasers either driven by chirped pulse amplification (CPA) laser systems or capillary discharge. The CPA systems drive lasing in neon-like or nickel-like ions, typically in the 10 – 30 nm range, while the capillary system works best for neon-like argon at 46.9 nm. Most researchers use nickel-like ion lasers near 14 nm because they are well matched to the Mo:Si multilayer mirrors that have peak reflectivity near 13 nm and are used in many applications. As a result, the last decade has seen the birth of the X-ray free electron laser (XFEL) that can reach wavelengths down to 0.15 nm and the inner-shell Ne laser at 1.46 nm.

Comparison between XAS, AWAXS and DAFS applied to nanometer scale supported metallic clusters. Pt.1; monometallic clusters

International Nuclear Information System (INIS)

Bazin, D.C.; Sayers, D.A.

1993-01-01

The structural information found using three techniques related to synchrotron radiation are compared. XAS (X-ray Absorption Spectroscopy), AWAXS (Anomalous Wide Angle X-ray Scattering) and DAFS (Diffraction Anomalous Fine Structure) are applied to nanometer scale metallic clusters. (author)

Electromigration in integrated circuit interconnects studied by X-ray microscopy

Energy Technology Data Exchange (ETDEWEB)

Schneider, G. E-mail: gschnei1@gwdg.de; Denbeaux, G.; Anderson, E.; Bates, W.; Salmassi, F.; Nachimuthu, P.; Pearson, A.; Richardson, D.; Hambach, D.; Hoffmann, N.; Hasse, W.; Hoffmann, K

2003-01-01

To study mass transport phenomena in advanced microelectronic devices with X-rays requires penetration of dielectric and Si layers up to 30 {mu}m thick. X-ray imaging at 1.8 keV photon energy provides a high amplitude contrast between Cu or Al interconnects and dielectric layers and can penetrate through the required thickness. To perform X-ray microscopy at 1.8 keV, a new Ru/Si multilayer was designed for the transmission X-ray microscope XM-1 installed at the Advanced Light Source in Berkeley. The mass flow in a passivated Cu interconnect was studied at current densities up to 10{sup 7} A/cm{sup 2}. In addition, we demonstrated the high material contrast from different elements in integrated circuits with a resolution of about 40 nm.

Electromigration in integrated circuit interconnects studied by X-ray microscopy

CERN Document Server

Schneider, G; Anderson, E; Bates, W; Salmassi, F; Nachimuthu, P; Pearson, A; Richardson, D; Hambach, D; Hoffmann, N; Hasse, W; Hoffmann, K

2003-01-01

To study mass transport phenomena in advanced microelectronic devices with X-rays requires penetration of dielectric and Si layers up to 30 mu m thick. X-ray imaging at 1.8 keV photon energy provides a high amplitude contrast between Cu or Al interconnects and dielectric layers and can penetrate through the required thickness. To perform X-ray microscopy at 1.8 keV, a new Ru/Si multilayer was designed for the transmission X-ray microscope XM-1 installed at the Advanced Light Source in Berkeley. The mass flow in a passivated Cu interconnect was studied at current densities up to 10 sup 7 A/cm sup 2. In addition, we demonstrated the high material contrast from different elements in integrated circuits with a resolution of about 40 nm.

Calculated efficiencies of three-material low stress coatings for diffractive x-ray transmission optics

International Nuclear Information System (INIS)

Kubec, Adam; Braun, Stefan; Gawlitza, Peter; Menzel, Maik; Leson, Andreas

2016-01-01

Diffractive X-ray optical elements made by thin film coating techniques such as multilayer Laue lenses (MLL) and multilayer zone plates (MZP) are promising approaches to achieve resolutions in hard X-ray microscopy applications of less than 10 nm. The challenge is to make a lens with a large numerical aperture on the one hand and a decent working distance on the other hand. One of the limiting factors with the coated structures is the internal stress in the films, which can lead to significant bending of the substrate and various types of unwanted diffraction effects. Several approaches have been discussed to overcome this challenge. One of these is a three-material combination such as Mo/MoSi_2/Si, where four single layers per period are deposited. Mo and Si represent the absorber and spacer in this case while MoSi_2 forms a diffusion barrier; in addition the thicknesses of absorber and spacer are chosen to minimize residual stress of the overall coating. Here the diffraction efficiency as well as the profile of the beam in the focal plane are discussed in order to find a tradeoff between lowest residual stress and best diffraction properties.

The polarized neutron reflectivity and X-ray reflectivity studies of the magnetic profiles of epitaxial Ni80Fe20/Ru multilayers

International Nuclear Information System (INIS)

Su, H.-C.; Peir, J.-J.; Lee, C.-H.; Lin, M.-Z.; Wu, P.-T.; Huang, J.C.A.; Tun Zin

2005-01-01

The depth profiles of the epitaxial Ni 80 Fe 20 (1 1 1)/Ru(0 0 0 1) multilayers were studied by polarized neutron reflectivity and X-ray reflectivity. At the Ru thickness that the anti-ferromagnetic coupling was found, the magnetic moments between two Ni 80 Fe 20 interlayers show a biquadratic coupling effect with a double unit cell at low applied fields. A magnetic dead layer of about 0.3 nm was also found at the interface boundaries. The maximal polarization effect applied to the Ru layer is less than 0.03μ B

Top layer's thickness dependence on total electron-yield X-ray standing-wave

International Nuclear Information System (INIS)

Ejima, Takeo; Yamazaki, Atsushi; Banse, Takanori; Hatano, Tadashi

2005-01-01

A Mo single-layer film with a stepwise thickness distribution was fabricated on the same Mo/Si reflection multilayer film. Total electron-yield X-ray standing-wave (TEY-XSW) spectra of the aperiodic multilayer were measured with reflection spectra. The peak positions of the standing waves in the TEY-XSW spectra changed as the film thickness of the top Mo-layer increased

Improvement of mechanical and tribological properties in steel surfaces by using titanium-aluminum/titanium-aluminum nitride multilayered system

Energy Technology Data Exchange (ETDEWEB)

Ipaz, L., E-mail: leoipazc@gmail.com [Thin Films Group, Physics departament, Universidad del Valle, Calle 13 100-00, A.A. 25360, Cali (Colombia); Caicedo, J.C. [Thin Films Group, Physics departament, Universidad del Valle, Calle 13 100-00, A.A. 25360, Cali (Colombia); Esteve, J. [Department de Fisica Aplicada i Optica, Universitat de Barcelona, Catalunya (Spain); Espinoza-Beltran, F.J. [Centro de Investigacion y de Estudios Avanzados del IPN, Unidad Queretaro, Libramiento Norponiente 2000, Fracc. Real de Juriquilla, C.P. 76230 (Mexico); Zambrano, G. [Thin Films Group, Physics departament, Universidad del Valle, Calle 13 100-00, A.A. 25360, Cali (Colombia)

2012-02-01

Improvement of mechanical and tribological properties on AISI D3 steel surfaces coated with [Ti-Al/Ti-Al-N]{sub n} multilayer systems deposited in various bilayer periods ({Lambda}) via magnetron co-sputtering pulsed d.c. method, from a metallic binary target; has been studied in this work exhaustively. The multilayer coatings were characterized in terms of structural, chemical, morphological, mechanical and tribological properties by X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), atomic force microscopy (AFM), scanning electron microscopy, nanoindentation, pin-on-disc and scratch tests, respectively. The failure mode mechanisms were studied by optical microscopy. Results from X-ray diffraction analysis revealed that the crystal structure of TiAl/TiAlN multilayer coatings has a tetragonal and FCC NaCl-type lattice structures for Ti-Al and Ti-Al-N, respectively, i.e., it was found to be non-isostructural multilayers. An enhancement of both hardness and elastic modulus up to 29 GPa and 260 GPa, respectively, was observed as the bilayer periods ({Lambda}) in the coatings were decreased. The sample with a bilayer period ({Lambda}) of 25 nm and bilayer number n = 100 showed the lowest friction coefficient ({approx}0.28) and the highest critical load (45 N), corresponding to 2.7 and 1.5 times better than those values for the coating deposited with n = 1, respectively. These results indicate an enhancement of mechanical, tribological and adhesion properties, comparing to the [Ti-Al/Ti-Al-N]{sub n} multilayer systems with 1 bilayer at 26%, 63% and 33%, respectively. This enhancement in hardness and toughness for multilayer coatings could be attributed to the different mechanisms for layer formation with nanometric thickness such as the novel Ti-Al/Ti-Al-N effect and the number of interfaces that act as obstacles for the crack deflection and dissipation of crack energy.

Tracing temperature in a nanometer size region in a picosecond time period.

Science.gov (United States)

Nakajima, Kaoru; Kitayama, Takumi; Hayashi, Hiroaki; Matsuda, Makoto; Sataka, Masao; Tsujimoto, Masahiko; Toulemonde, Marcel; Bouffard, Serge; Kimura, Kenji

2015-08-21

Irradiation of materials with either swift heavy ions or slow highly charged ions leads to ultrafast heating on a timescale of several picosecond in a region of several nanometer. This ultrafast local heating result in formation of nanostructures, which provide a number of potential applications in nanotechnologies. These nanostructures are believed to be formed when the local temperature rises beyond the melting or boiling point of the material. Conventional techniques, however, are not applicable to measure temperature in such a localized region in a short time period. Here, we propose a novel method for tracing temperature in a nanometer region in a picosecond time period by utilizing desorption of gold nanoparticles around the ion impact position. The feasibility is examined by comparing with the temperature evolution predicted by a theoretical model.

Advanced Nanoscale Characterization of Cement Based Materials Using X-Ray Synchrotron Radiation: A Review

KAUST Repository

Chae, Sejung R.; Moon, Juhyuk; Yoon, Seyoon; Bae, Sungchul; Levitz, Pierre; Winarski, Robert; Monteiro, Paulo J. M.

2013-01-01

We report various synchrotron radiation laboratory based techniques used to characterize cement based materials in nanometer scale. High resolution X-ray transmission imaging combined with a rotational axis allows for rendering of samples in three

Generation of X-rays by electrons recycling through thin internal targets of cyclic accelerators

Science.gov (United States)

Kaplin, V.; Kuznetsov, S.; Uglov, S.

2018-05-01

The use of thin (recycling effect) of electrons through them. The multiplicity of electron passes (M) is determined by the electron energy, accelerator parameters, the thickness, structure and material of a target and leads to an increase in the effective target thickness and the efficiency of radiation generation. The increase of M leads to the increase in the emittance of electron beams which can change the characteristics of radiation processes. The experimental results obtained using the Tomsk synchrotron and betatron showed the possibility of increasing the yield and brightness of coherent X-rays generated by the electrons passing (recycling) through thin crystals and periodic multilayers placed into the chambers of accelerators, when the recycling effect did not influence on the spectral and angular characteristics of generated X-rays.

Resolving the three-dimensional microstructure of polymer electrolyte fuel cell electrodes using nanometer-scale X-ray computed tomography

Energy Technology Data Exchange (ETDEWEB)

Epting, William K.; Gelb, Jeff; Litster, Shawn

2012-02-08

The electrodes of a polymer electrolyte fuel cell (PEFC) are composite porous layers consisting of carbon and platinum nanoparticles and a polymer electrolyte binder. The proper composition and arrangement of these materials for fast reactant transport and high electrochemical activity is crucial to achieving high performance, long lifetimes, and low costs. Here, the microstructure of a PEFC electrode using nanometer-scale X-ray computed tomography (nano-CT) with a resolution of 50 nm is investigated. The nano-CT instrument obtains this resolution for the low-atomic-number catalyst support and binder using a combination of a Fresnel zone plate objective and Zernike phase contrast imaging. High-resolution, non-destructive imaging of the three-dimensional (3D) microstructures provides important new information on the size and form of the catalyst particle agglomerates and pore spaces. Transmission electron microscopy (TEM) and mercury intrusion porosimetry (MIP) is applied to evaluate the limits of the resolution and to verify the 3D reconstructions. The computational reconstructions and size distributions obtained with nano-CT can be used for evaluating electrode preparation, performing pore-scale simulations, and extracting effective morphological parameters for large-scale computational models. (Copyright copyright 2012 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim)

Comparison between XAS, AWAXS and DAFS applied to nanometer scale supported metallic clusters. Pt.2; bimetallic clusters

International Nuclear Information System (INIS)

Bazin, D.; Sayers, D.

1993-01-01

The structural information obtained using three techniques related to synchrotron radiation are compared. XAS (X-ray Absorption Spectroscopy), AWAXS (Anomalous Wide Angle X-ray Scattering) and DAFS (Diffraction Anomalous Fine Structure) are applied to the study of nanometer scale bimetallic clusters. (author)

Engineering polyelectrolyte multilayer structure at the nanometer length scale by tuning polymer solution conformation.

Science.gov (United States)

Boddohi, Soheil; Killingsworth, Christopher; Kipper, Matt

2008-03-01

Chitosan (a weak polycation) and heparin (a strong polyanion) are used to make polyelectrolyte multilayers (PEM). PEM thickness and composition are determined as a function of solution pH (4.6 to 5.8) and ionic strength (0.1 to 0.5 M). Over this range, increasing pH increases the PEM thickness; however, the sensitivity to changes in pH is a strong function of ionic strength. The PEM thickness data are correlated to the polymer conformation in solution. Polyelectrolyte conformation in solution is characterized by gel permeation chromatography (GPC). The highest sensitivity of PEM structure to pH is obtained at intermediate ionic strength. Different interactions govern the conformation and adsorption phenomena at low and high ionic strength, leading to reduced sensitivity to solution pH at extreme ionic strengths. The correspondence between PEM thickness and polymer solution conformation offers opportunities to tune polymer thin film structure at the nanometer length scale by controlling simple, reproducible processing conditions.

Sub-nanometer periodic nonlinearity error in absolute distance interferometers

Science.gov (United States)

Yang, Hongxing; Huang, Kaiqi; Hu, Pengcheng; Zhu, Pengfei; Tan, Jiubin; Fan, Zhigang

2015-05-01

Periodic nonlinearity which can result in error in nanometer scale has become a main problem limiting the absolute distance measurement accuracy. In order to eliminate this error, a new integrated interferometer with non-polarizing beam splitter is developed. This leads to disappearing of the frequency and/or polarization mixing. Furthermore, a strict requirement on the laser source polarization is highly reduced. By combining retro-reflector and angel prism, reference and measuring beams can be spatially separated, and therefore, their optical paths are not overlapped. So, the main cause of the periodic nonlinearity error, i.e., the frequency and/or polarization mixing and leakage of beam, is eliminated. Experimental results indicate that the periodic phase error is kept within 0.0018°.

Moving the Frontier of Quantum Control into the Soft X-Ray Spectrum

Directory of Open Access Journals (Sweden)

A. Aquila

2011-01-01

Full Text Available The femtosecond nature of X-ray free electron laser (FEL pulses opens up exciting research possibilities in time-resolved studies including femtosecond photoemission and diffraction. The recent developments of seeding X-ray FELs extend their capabilities by creating stable, temporally coherent, and repeatable pulses. This in turn opens the possibility of spectral engineering soft X-ray pulses to use as a probe for the control of quantum dynamics. We propose a method for extending coherent control pulse-shaping techniques to the soft X-ray spectral range by using a reflective geometry 4f pulse shaper. This method is based on recent developments in asymmetrically cut multilayer optic technology and piezoelectric substrates.

X-ray photoelectron spectroscopy of nano-multilayered Zr-O/Al-O coatings deposited by cathodic vacuum arc plasma

International Nuclear Information System (INIS)

Zhitomirsky, V.N.; Kim, S.K.; Burstein, L.; Boxman, R.L.

2010-01-01

Nano-multilayered Zr-O/Al-O coatings with alternating Zr-O and Al-O layers having a bi-layer period of 6-7 nm and total coating thickness of 1.0-1.2 μm were deposited using a cathodic vacuum arc plasma process on rotating Si substrates. Plasmas generated from two cathodes, Zr and Al, were deposited simultaneously in a mixture of Ar and O 2 background gases. The Zr-O/Al-O coatings, as well as bulk ZrO 2 and Al 2 O 3 reference samples, were studied using X-ray photoelectron spectroscopy (XPS). The XPS spectra were analyzed on the surface and after sputtering with a 4 kV Ar + ion gun. High resolution angle resolved spectra were obtained at three take-off angles: 15 o , 45 o and 75 o relative to the sample surface. It was shown that preferential sputtering of oxygen took place during XPS of bulk reference ZrO 2 samples, producing ZrO and free Zr along with ZrO 2 in the XPS spectra. In contrast, no preferential sputtering was observed with Al 2 O 3 reference samples. The Zr-O/Al-O coatings contained a large amount of free metals along with their oxides. Free Zr and Al were observed in the coating spectra both before and after sputtering, and thus cannot be due solely to preferential sputtering. Transmission electron microscopy revealed that the Zr-O/Al-O coatings had a nano-multilayered structure with well distinguished alternating layers. However, both of the alternating layers of the coating contained of a mixture of aluminum and zirconium oxides and free Al and Zr metals. The concentration of Zr and Al changed periodically with distance normal to the coating surface: the Zr maximum coincided with the Al minimum and vice versa. However the concentration of Zr in both alternating layers was significantly larger than that of Al. Despite the large free metal concentration, the Knoop hardness, 21.5 GPa, was relatively high, which might be attributed to super-lattice formation or formation of a metal-oxide nanocomposite within the layers.

X-ray photoelectron microscope with a compact x-ray source generated by line-focused laser irradiation

International Nuclear Information System (INIS)

Yamaguchi, N.; Okamoto, Y.; Hara, T.; Takahashi, Z.; Nishimura, Y.; Sakata, A.; Watanabe, K.; Azuma, H.

2004-01-01

Full text: A laboratory-sized microscopic system of x-ray photoelectrons has been developing using a compact x-ray source produced by line-focused laser irradiation. The system is a scanning type photoelectron microscope where x-ray beam is micro-focused via a Schwartzschild optics. A compact laser-plasma x-ray source has been developed with a YAG laser system, a line-focus lens system, a tape-target driving system and a debris prevention system, that was operated at repetition rate of 10 Hz or 50 Hz. X-rays were delivered along line plasma whose length was 0.6 to 11 mm with higher intensity than that from a point-focused source. Because the transition line of Al V (13.1 nm) was prominent in the soft x-ray spectrum when the Al tape target irradiated at the lower power density of 10 11 W/cm 2 , the 13.1 nm x-ray was used as an excitation source. The Schwartzschild optics was set on the beamline at a distance about 1 m from the source, which was coated with Mo/Si multilayers for 13.1 nm x-ray. The designed demagnification is 224 that was confirmed in the previous experiment. Therefore, an x-ray micro spot of sub-micron size can be formed on a sample surface when the source size is less than about 0.2 mm. Samples were set on a two-axis high-precision piezo stage mounted to a four-axis manipulator. The electron energy analyzer was a spherical capacitor analyzer with mean diameter of 279.4 mm. The electron detector was a microchannel plate (MCP) with a phosphor screen and the optical image of electrons on the exit plane of the analyzer was taken and recorded by using an ultra low dark noise CCD camera, that was suited for detection of vast photoelectrons excited by x-ray pulse of ns-order duration. We performed spatial resolution test measurements by using a GaAs wafer coated with photo-resist that formed a stripe pattern. The spatial resolution less than 3 micron has been obtained from the variation of As 3d electron intensity along the position of the GaAs sample

Fabrication of multilayer nanowires

Energy Technology Data Exchange (ETDEWEB)

Kaur, Jasveer, E-mail: kaurjasveer89@gmail.com; Singh, Avtar; Kumar, Davinder [Department of Physics, Punjabi University Patiala, 147002, Punjab (India); Thakur, Anup; Kaur, Raminder, E-mail: raminder-k-saini@yahoo.com [Department of Basic and Applied Sciences, Punjabi University Patiala, 147002, Punjab (India)

2016-05-06

Multilayer nanowires were fabricated by potentiostate ectrodeposition template synthesis method into the pores of polycarbonate membrane. In present work layer by layer deposition of two different metals Ni and Cu in polycarbonate membrane having pore size of 600 nm were carried out. It is found that the growth of nanowires is not constant, it varies with deposition time. Scanning electron microscopy (SEM) is used to study the morphology of fabricated multilayer nanowires. An energy dispersive X-ray spectroscopy (EDS) results confirm the composition of multilayer nanowires. The result shows that multilayer nanowires formed is dense.

Fabrication of multilayer nanowires

International Nuclear Information System (INIS)

Kaur, Jasveer; Singh, Avtar; Kumar, Davinder; Thakur, Anup; Kaur, Raminder

2016-01-01

Multilayer nanowires were fabricated by potentiostate ectrodeposition template synthesis method into the pores of polycarbonate membrane. In present work layer by layer deposition of two different metals Ni and Cu in polycarbonate membrane having pore size of 600 nm were carried out. It is found that the growth of nanowires is not constant, it varies with deposition time. Scanning electron microscopy (SEM) is used to study the morphology of fabricated multilayer nanowires. An energy dispersive X-ray spectroscopy (EDS) results confirm the composition of multilayer nanowires. The result shows that multilayer nanowires formed is dense.

First images from the Stanford tabletop scanning soft x-ray microscope

International Nuclear Information System (INIS)

Trail, J.A.; Byer, R.L.

1988-01-01

The authors have constructed a scanning soft x-ray microscope which uses a laser-produced plasma as the soft x-ray source and normal incidence multilayer coated mirrors in a Schwarzschild configuration as the focusing optics. The microscope operates at a wavelength of 140 angstrom, has a spatial resolution of 0.5 μm, and has a soft x-ray photon flux through the focus of 10 4 s -1 when operated with only 170 mW of average laser power. The microscope is compact; the complete system, including the laser, fits on a single optical table. In this paper they describe the microscope and present images of metallic microstructures

Binary pseudo-random patterned structures for modulation transfer function calibration and resolution characterization of a full-field transmission soft x-ray microscope

Energy Technology Data Exchange (ETDEWEB)

Yashchuk, V. V., E-mail: VVYashchuk@lbl.gov; Chan, E. R.; Lacey, I. [Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States); Fischer, P. J. [Center for X-Ray Optics, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States); Physics Department, University of California Santa Cruz, Santa Cruz, California 94056 (United States); Conley, R. [Advance Photon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States); National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, New York 11973 (United States); McKinney, W. R. [Diablo Valley College, 321 Golf Club Road, Pleasant Hill, California 94523 (United States); Artemiev, N. A. [KLA-Tencor Corp., 1 Technology Drive, Milpitas, California 95035 (United States); Bouet, N. [National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, New York 11973 (United States); Cabrini, S. [Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States); Calafiore, G.; Peroz, C.; Babin, S. [aBeam Technologies, Inc., Hayward, California 94541 (United States)

2015-12-15

We present a modulation transfer function (MTF) calibration method based on binary pseudo-random (BPR) one-dimensional sequences and two-dimensional arrays as an effective method for spectral characterization in the spatial frequency domain of a broad variety of metrology instrumentation, including interferometric microscopes, scatterometers, phase shifting Fizeau interferometers, scanning and transmission electron microscopes, and at this time, x-ray microscopes. The inherent power spectral density of BPR gratings and arrays, which has a deterministic white-noise-like character, allows a direct determination of the MTF with a uniform sensitivity over the entire spatial frequency range and field of view of an instrument. We demonstrate the MTF calibration and resolution characterization over the full field of a transmission soft x-ray microscope using a BPR multilayer (ML) test sample with 2.8 nm fundamental layer thickness. We show that beyond providing a direct measurement of the microscope’s MTF, tests with the BPRML sample can be used to fine tune the instrument’s focal distance. Our results confirm the universality of the method that makes it applicable to a large variety of metrology instrumentation with spatial wavelength bandwidths from a few nanometers to hundreds of millimeters.

Binary pseudo-random patterned structures for modulation transfer function calibration and resolution characterization of a full-field transmission soft x-ray microscope

International Nuclear Information System (INIS)

Yashchuk, V. V.; Chan, E. R.; Lacey, I.; Fischer, P. J.; Conley, R.; McKinney, W. R.; Artemiev, N. A.; Bouet, N.; Cabrini, S.; Calafiore, G.; Peroz, C.; Babin, S.

2015-01-01

We present a modulation transfer function (MTF) calibration method based on binary pseudo-random (BPR) one-dimensional sequences and two-dimensional arrays as an effective method for spectral characterization in the spatial frequency domain of a broad variety of metrology instrumentation, including interferometric microscopes, scatterometers, phase shifting Fizeau interferometers, scanning and transmission electron microscopes, and at this time, x-ray microscopes. The inherent power spectral density of BPR gratings and arrays, which has a deterministic white-noise-like character, allows a direct determination of the MTF with a uniform sensitivity over the entire spatial frequency range and field of view of an instrument. We demonstrate the MTF calibration and resolution characterization over the full field of a transmission soft x-ray microscope using a BPR multilayer (ML) test sample with 2.8 nm fundamental layer thickness. We show that beyond providing a direct measurement of the microscope’s MTF, tests with the BPRML sample can be used to fine tune the instrument’s focal distance. Our results confirm the universality of the method that makes it applicable to a large variety of metrology instrumentation with spatial wavelength bandwidths from a few nanometers to hundreds of millimeters

The structural and magnetic properties of Fe/native-oxide systems resolved by x-ray scattering and spectroscopy methods

International Nuclear Information System (INIS)

Couet, Sebastien

2008-12-01

Since the discovery of the giant magnetoresistance (GMR) effect in metallic magnetic multilayers and its industrial application in magnetic read heads, the data storage density and reading speed of hard disks steadily increased. But now the point is reached where conventional conductive multilayer structures suffer from parasitic eddy currents which decrease the signal to noise ratio of the system. To tackle this problem, new classes of materials have to be studied. One approach is to introduce ultra thin oxide layers in a metallic iron structure to reduce the conductivity while keeping a high net magnetization. This can be achieved by alternating metal deposition and controlled oxidation to produce metal/metal-oxide multilayers. However, the magnetic structure that forms in such multilayer is still rather unexplored. The aim of this work was to achieve a better understanding of the magnetic structure that forms in such iron/native-oxide multilayers. For that purpose, X-ray and neutron scattering experiments were carried out to determine the magnetic structure and its evolution in ex-situ and in-situ experiments, respectively. It was found that a non-collinear magnetic coupling appears between the metal layers, which is mediated by the antiferromagnetically ordered oxide layer in between. The use of isotope sensitive scattering techniques (namely nuclear resonant scattering and neutron reflectometry) allowed to resolve the magnetic depth profile of the system, showing that the buried oxide carries a net magnetic moment. The chemical and magnetic structure of the buried oxide was studied by in-situ X-ray absorption spectroscopy and nuclear resonant scattering. After oxidation, the layer exhibits a mixture of different oxide phases and incorporates 10 to 15% of Fe with metallic character. Upon deposition of only one atomic layer of metallic Fe, the layer reduces to a single phase FeO-like oxide. This structural change does not lead to a magnetically ordered oxide

The structural and magnetic properties of Fe/native-oxide systems resolved by x-ray scattering and spectroscopy methods

Energy Technology Data Exchange (ETDEWEB)

Couet, Sebastien

2008-12-15

Since the discovery of the giant magnetoresistance (GMR) effect in metallic magnetic multilayers and its industrial application in magnetic read heads, the data storage density and reading speed of hard disks steadily increased. But now the point is reached where conventional conductive multilayer structures suffer from parasitic eddy currents which decrease the signal to noise ratio of the system. To tackle this problem, new classes of materials have to be studied. One approach is to introduce ultra thin oxide layers in a metallic iron structure to reduce the conductivity while keeping a high net magnetization. This can be achieved by alternating metal deposition and controlled oxidation to produce metal/metal-oxide multilayers. However, the magnetic structure that forms in such multilayer is still rather unexplored. The aim of this work was to achieve a better understanding of the magnetic structure that forms in such iron/native-oxide multilayers. For that purpose, X-ray and neutron scattering experiments were carried out to determine the magnetic structure and its evolution in ex-situ and in-situ experiments, respectively. It was found that a non-collinear magnetic coupling appears between the metal layers, which is mediated by the antiferromagnetically ordered oxide layer in between. The use of isotope sensitive scattering techniques (namely nuclear resonant scattering and neutron reflectometry) allowed to resolve the magnetic depth profile of the system, showing that the buried oxide carries a net magnetic moment. The chemical and magnetic structure of the buried oxide was studied by in-situ X-ray absorption spectroscopy and nuclear resonant scattering. After oxidation, the layer exhibits a mixture of different oxide phases and incorporates 10 to 15% of Fe with metallic character. Upon deposition of only one atomic layer of metallic Fe, the layer reduces to a single phase FeO-like oxide. This structural change does not lead to a magnetically ordered oxide

Scintillating Quantum Dots for Imaging X-rays (SQDIX) for Aircraft Inspection

Science.gov (United States)

Burke, Eric (Principal Investigator); Williams, Phillip (Principal Investigator); Dehaven, Stan

2015-01-01

Scintillation is the process currently employed by conventional x-ray detectors to create x-ray images. Scintillating quantum dots or nano-crystals (StQDs) are a novel, nanometer-scale material that upon excitation by x-rays, re-emit the absorbed energy as visible light. StQDs theoretically have higher output efficiency than conventional scintillating materials and are more environmental friendly. This paper will present the characterization of several critical elements in the use of StQDs that have been performed along a path to the use of this technology in wide spread x-ray imaging. Initial work on the SQDIX system has shown great promise to create state-of-the-art sensors using StQDs as a sensor material. In addition, this work also demonstrates a high degree of promise using StQDs in microstructured fiber optics. Using the microstructured fiber as a light guide could greatly increase the capture efficiency a StQDs based imaging sensor.

Crystalline and quasi-crystalline patterns in X-Ray diffraction from periodic arrays of quantum dots

NARCIS (Netherlands)

Darhuber, A.A.; Holy, V.; Bauer, G.; Wang, P.D.; Song, Y.P.; Sotomayor Torres, C.M.; Holland, M.C.

1995-01-01

The structural properties of a square periodic array of quantum dots of a GaAs/AlAs superlattice were studied by x-ray diffractometry. If the azimuthal direction of the primary beam can be expressed by integer Miller indices, the profile is perfectly periodic. However, if its azimuthal orientation

Characterization of thin-film multilayers using magnetization curves and modeling of low-angle X-ray diffraction data

Energy Technology Data Exchange (ETDEWEB)

Lane, M. [Emory & Henry College, VA (United States); Chaiken, A.; Michel, R.P. [Lawrence Livermore National Lab., CA (United States)

1994-12-01

We have characterized thin-film multilayers grown by ion-beam sputtering using magnetization curves and modeling of low-angle x-ray diffraction data. In our films, we use ferromagnetic layer = Co, Fe, and NiFe and spacer layer = Si, Ge, FeSi{sub 2}, and CoSi{sub 2}. We have studied the effects of (1) deposition conditions; (2) thickness of layers; (3) different layer materials; and (4) annealing. We find higher magnetization in films grown at 1000V rather than 500V and in films with spacer layers of 50{angstrom} rather than 100{angstrom}. We find higher coercivity in films with cobalt grown on germanium rather than silicon, metal grown on gold underlayers rather than on glass substrates, and when using thinner spacer layers. Finally, modeling reveals that films grown with disilicide layers are more thermally stable than films grown with silicon spacer layers.

Short-period AM CVn systems as optical, X-ray and gravitational-wave sources

NARCIS (Netherlands)

Nelemans, G.; Yungelson, L.; Portegies Zwart, S.F.

2004-01-01

We model the population of AM CVn systems in the Galaxy and discuss the detectability of these systems with optical, X-ray and gravitational-wave detectors. We concentrate on the short-period (P < 1500 s) systems, some of which are expected to be in a phase of direct-impact accretion. Using a

A multiwavelength study of SXP 1062, the long-period X-ray pulsar associated with a supernova remnant

Science.gov (United States)

González-Galán, A.; Oskinova, L. M.; Popov, S. B.; Haberl, F.; Kühnel, M.; Gallagher, J.; Schurch, M. P. E.; Guerrero, M. A.

2018-04-01

SXP 1062 is a Be X-ray binary (BeXB) located in the Small Magellanic Cloud. It hosts a long-period X-ray pulsar and is likely associated with the supernova remnant MCSNR J0127-7332. In this work we present a multiwavelength view on SXP 1062 in different luminosity regimes. We consider monitoring campaigns in optical (OGLE survey) and X-ray (Swift telescope). During these campaigns a tight coincidence of X-ray and optical outbursts is observed. We interpret this as typical Type I outbursts as often detected in BeXBs at periastron passage of the neutron star (NS). To study different X-ray luminosity regimes in depth, during the source quiescence we observed it with XMM-Newton while Chandra observations followed an X-ray outburst. Nearly simultaneously with Chandra observations in X-rays, in optical the RSS/SALT telescope obtained spectra of SXP 1062. On the basis of our multiwavelength campaign we propose a simple scenario where the disc of the Be star is observed face-on, while the orbit of the NS is inclined with respect to the disc. According to the model of quasi-spherical settling accretion our estimation of the magnetic field of the pulsar in SXP 1062 does not require an extremely strong magnetic field at the present time.

Small angles X-ray diffraction and Mössbauer characterization of ...

Indian Academy of Sciences (India)

The effect of thermal annealing on the structure and magnetic properties of crystalline Tb/Fe multilayers has been studied using conversion electron Mössbauer spectrometry and small-angle X-ray diffraction. The growth of Tb–Fe amorphous alloy from the interface is observed with increasing annealing temperature.

Design and fabrication of heat resistant multilayers

International Nuclear Information System (INIS)

Thorne, J.M.; Knight, L.V.; Peterson, B.G.; Perkins, R.T.; Gray, K.J.

1986-01-01

Many promising applications of multilayer x-ray optical elements subject them to intense radiation. This paper discusses the selection of optimal pairs of materials to resist heat damage and presents simulations of multilayer performance under extreme heat loadings

Observation of a Short Period Quasi-periodic Pulsation in Solar X-Ray, Microwave, and EUV Emissions

Energy Technology Data Exchange (ETDEWEB)

Kumar, Pankaj; Cho, Kyung-Suk [Korea Astronomy and Space Science Institute (KASI), Daejeon, 305-348 (Korea, Republic of); Nakariakov, Valery M., E-mail: pankaj@kasi.re.kr [Centre for Fusion, Space and Astrophysics, Department of Physics, University of Warwick, CV4 7AL (United Kingdom)

2017-02-10

This paper presents the multiwavelength analysis of a 13 s quasi-periodic pulsation (QPP) observed in hard X-ray (12–300 keV) and microwave (4.9–34 GHz) emissions during a C-class flare that occurred on 2015 September 21. Atmospheric Image Assembly (AIA) 304 and 171 Å images show an emerging loop/flux tube (L1) moving radially outward, which interacts with the preexisting structures within the active region (AR). The QPP was observed during the expansion of and rising motion of L1. The Nobeyama Radioheliograph microwave images in 17/34 GHz channels reveal a single radio source that was co-spatial with a neighboring loop (L2). In addition, using AIA 304 Å images, we detected intensity oscillations in the legs of L2 with a period of about 26 s. A similar oscillation period was observed in the GOES soft X-ray flux derivative. This oscillation period seems to increase with time. We suggest that the observed QPP is most likely generated by the interaction between L2 and L3 observed in the AIA hot channels (131 and 94 Å). The merging speed of loops L2 and L3 was ∼35 km s{sup −1}. L1 was destroyed possibly by its interaction with preexisting structures in the AR, and produced a cool jet with the speed of ∼106–118 km s{sup −1} associated with a narrow CME (∼770 km s{sup −1}). Another mechanism of the QPP in terms of a sausage oscillation of the loop (L2) is also possible.

On the Nature of the mHz X-ray Quasi-Periodic Oscillations from Ultraluminous X-ray source M82 X-1: Search for Timing-Spectral Correlations

Science.gov (United States)

Pasham, Dheeraj R.; Strohmayer, Tod E.

2013-01-01

Using all the archival XMM-Newton X-ray (3-10 keV) observations of the ultraluminous X-ray source (ULX) M82 X-1, we searched for a correlation between its variable mHz quasi-periodic oscillation (QPO) frequency and its hardness ratio (5-10 keV/3-5 keV), an indicator of the energy spectral power-law index. When stellar-mass black holes (StMBHs) exhibit type-C low-frequency QPOs (0.2-15 Hz), the centroid frequency of the QPO is known to correlate with the energy spectral index. The detection of such a correlation would strengthen the identification of M82 X-1's mHz QPOs as type-C and enable a more reliable mass estimate by scaling its QPO frequencies to those of type-C QPOs in StMBHs of known mass.We resolved the count rates and the hardness ratios of M82 X-1 and a nearby bright ULX (source 5/X42.3+59) through surface brightness modeling.We detected QPOs in the frequency range of 36-210 mHz during which M82 X-1's hardness ratio varied from 0.42 to 0.47. Our primary results are (1) that we do not detect any correlation between the mHz QPO frequency and the hardness ratio (a substitute for the energy spectral power-law index) and (2) similar to some accreting X-ray binaries, we find that M82 X-1's mHz QPO frequency increases with its X-ray count rate (Pearson's correlation coefficient = +0.97). The apparent lack of a correlation between the QPO centroid frequency and the hardness ratio poses a challenge to the earlier claims that the mHz QPOs of M82 X-1 are the analogs of the type-C low-frequency QPOs of StMBHs. On the other hand, it is possible that the observed relation between the hardness ratio and the QPO frequency represents the saturated portion of the correlation seen in type-C QPOs of StMBHs-in which case M82 X-1's mHz QPOs can still be analogous to type-C QPOs.

On the spin period distribution in Be/X-ray binaries

Energy Technology Data Exchange (ETDEWEB)

Cheng, Z.-Q.; Shao, Y.; Li, X.-D., E-mail: lixd@nju.edu.cn [Department of Astronomy, Nanjing University, Nanjing 210093 (China)

2014-05-10

There is a remarkable correlation between the spin periods of the accreting neutron stars (NSs) in Be/X-ray binaries (BeXBs) and their orbital periods. Recently, Knigge et al. showed that the distribution of the spin periods contains two distinct subpopulations peaked at ∼10 s and ∼200 s, respectively, and suggested that they may be related to two types of supernovae for the formation of the NSs, i.e., core-collapse and electron-capture supernovae. Here we propose that the bimodal spin period distribution is likely to be ascribed to different accretion modes of the NSs in BeXBs. When the NS tends to capture material from the warped, outer part of the Be star disk and experiences giant outbursts, a radiatively cooling dominated disk is formed around the NS, which spins up the NS and is responsible for the short-period subpopulation. In BeXBs that are dominated by normal outbursts or are persistent, the accretion flow is advection-dominated or quasi-spherical. The spin-up process is accordingly inefficient, leading to longer periods of the neuron stars. The potential relation between the subpopulations and the supernova mechanism is also discussed.

Elemental profiling of laser cladded multilayer coatings by laser induced breakdown spectroscopy and energy dispersive X-ray spectroscopy

Science.gov (United States)

Lednev, V. N.; Sdvizhenskii, P. A.; Filippov, M. N.; Grishin, M. Ya.; Filichkina, V. A.; Stavertiy, A. Ya.; Tretyakov, R. S.; Bunkin, A. F.; Pershin, S. M.

2017-09-01

Multilayer tungsten carbide wear resistant coatings were analyzed by laser induced breakdown spectroscopy (LIBS) and energy dispersive X-ray (EDX) spectroscopy. Coaxial laser cladding technique was utilized to produce tungsten carbide coating deposited on low alloy steel substrate with additional inconel 625 interlayer. EDX and LIBS techniques were used for elemental profiling of major components (Ni, W, C, Fe, etc.) in the coating. A good correlation between EDX and LIBS data was observed while LIBS provided additional information on light element distribution (carbon). A non-uniform distribution of tungsten carbide grains along coating depth was detected by both LIBS and EDX. In contrast, horizontal elemental profiling showed a uniform tungsten carbide particles distribution. Depth elemental profiling by layer-by-layer LIBS analysis was demonstrated to be an effective method for studying tungsten carbide grains distribution in wear resistant coating without any sample preparation.

Submicron resolution X-ray diffraction from periodically patterned GaAs nanorods grown onto Ge[111

Energy Technology Data Exchange (ETDEWEB)

Davydok, Anton; Biermanns, Andreas; Pietsch, Ullrich [Solid State Physics, Siegen University (Germany); Grenzer, Joerg [FZ-Dresden Rossendorf, Dresden (Germany); Paetzelt, Hendrik; Gottschalch, Volker; Bauer, Jens [Solid State Chemistry, University of Leipzig (Germany)

2009-08-15

We present high-resolution X-ray diffraction pattern of periodic GaAs nanorods (NRs) ensembles and individual GaAs NRs grown catalyst-free throughout a pre-patterned amorphous SiN{sub x} mask onto Ge[111]B surfaces by selective-area MOVPE method. To the best of our knowledge this is the first report about nano-structure X-ray characterization growth on non-polar substrate. The experiment has been performed at home laboratory and using synchrotron radiation using a micro-sized beam prepared by compound refractive lenses. Due to the non-polar character of the substrate the shapes of NRs appear not uniform and vary between deformed hexagonal and trigonal in symmetry. Because the average diameter of NRs equals the experimental resolution certain cuts through slightly inclined edges or corners of individual NRs with lateral size of about 225 nm could be selected using spatially resolved reciprocal space mapping. (Abstract Copyright [2009], Wiley Periodicals, Inc.)

Influence of multiple scattering of a relativistic electron in a periodic layered medium on coherent X-ray radiation

Energy Technology Data Exchange (ETDEWEB)

Blazhevich, S. V.; Kos’kova, T. V.; Noskov, A. V., E-mail: noskovbupk@mail.ru [Belgorod State National Research University (Russian Federation)

2016-01-15

A dynamic theory of coherent X-ray radiation generated in a periodic layered medium by a relativistic electron multiply scattered by target atoms has been developed. The expressions describing the spectral–angular characteristics of parametric X-ray radiation and diffracted transition radiation are derived. Numerical calculations based on the derived expressions have been performed.

Small angles X-ray diffraction and Mössbauer characterization of ...

Indian Academy of Sciences (India)

Abstract. The effect of thermal annealing on the structure and magnetic properties of crystalline Tb/Fe multilayers has been studied using conversion electron Mössbauer spectrometry and small-angle X-ray diffraction. The growth of Tb–Fe amorphous alloy from the interface is observed with increasing annealing ...

Portable and micro x-ray fluorescence investigations of the wall paintings belonging to different periods of anatolian history

International Nuclear Information System (INIS)

Zararsiz, A.; Ozen, L.; Kalayci, Y.

2014-01-01

Full text: In this study portable x-ray fluorescence spectrometer and micro x-ray fluorescence spectrometer were used for investigating the pigments on the Chatalhoyuk wall paintings from the neolithic period which are located in Museum of Anatolian Civilizations. Totally 15 artifacts were investigated in this study and the elemental compositions of the pigments were identified on this paintings. The communities which have lived in different periods of time have revealed different cultures during the 12 000 years old cultural heritage in our country

XRASE: The X-Ray Spectroscopic Explorer

DEFF Research Database (Denmark)

Schnopper, H.W.; Silver, E.; Murray, S.

2001-01-01

baryonic matter, the mass of black holes and the formation of disks and jets in AGN and galactic binaries. XRASE has a thin foil, multilayered telescope with a large collecting area up to 10 keV, especially in the Fe K alpha region (1100 cm(2)). Its microcalorimeter array combines high energy resolution (7...... eV at 6 keV) and efficiency with a field-of-view of 26 arcmin(2) . A deep orbit allows for long, continuous observations. Monitoring instruments in the optical (WOM-X), UV (TAUVEX) and hard X-RAY (GRAM) bands will offer exceptional opportunities to make simultaneous multi-wavelength observations....

Formation of silicon nanocrystals in multilayer nanoperiodic a-SiO{sub x}/insulator structures from the results of synchrotron investigations

Energy Technology Data Exchange (ETDEWEB)

Turishchev, S. Yu., E-mail: tsu@phys.vsu.ru; Terekhov, V. A.; Koyuda, D. A. [Voronezh State University (Russian Federation); Ershov, A. V.; Mashin, A. I. [Lobachevsky State University of Nizhny Novgorod (Russian Federation); Parinova, E. V.; Nesterov, D. N. [Voronezh State University (Russian Federation); Grachev, D. A.; Karabanova, I. A. [Lobachevsky State University of Nizhny Novgorod (Russian Federation); Domashevskaya, E. P. [Voronezh State University (Russian Federation)

2017-03-15

The problem of the efficiency of the controllable formation of arrays of silicon nanoparticles is studied on the basis of detailed investigations of the electronic structure of multilayer nanoperiodic a-SiO{sub x}/SiO{sub 2}, a-SiO{sub x}/Al{sub 2}O{sub 3}, and a-SiO{sub x}/ZrO{sub 2} compounds. Using synchrotron radiation and the X-ray absorption near edge structure (XANES) spectroscopy technique, a modification is revealed for the investigated structures under the effect of high-temperature annealing at the highest temperature of 1100°C; this modification is attributed to the formation of silicon nanocrystals in the layers of photoluminescent multilayer structures.

High resolution electron microscopy study of as-prepared and annealed tungsten-carbon multilayers

International Nuclear Information System (INIS)

Nguyen, T.D.; Gronsky, R.; Kortright, J.B.

1988-12-01

A series of sputtered tungsten-carbon multilayer structures with periods ranging from 2 to 12 nm in the as-prepared state and after annealing at 500/degree/C for 4 hours has been studied with high resolution transmission electron microscopy. The evolution with annealing of the microstructure of these multilayers depends on their period. As-prepared structures appear predominantly amorphous from TEM imaging and diffraction. Annealing results in crystallization of the W-rich layers into WC in the larger period samples, and less complete or no crystallization in the smaller period samples. X-ray scattering reveals that annealing expands the period in a systematic way. The layers remain remarkably well-defined after annealing under these conditions. 12 refs., 4 figs., 1 tab

Grazing angle X-ray fluorescence from periodic structures on silicon and silica surfaces

International Nuclear Information System (INIS)

Nowak, S.H.; Banaś, D.; Błchucki, W.; Cao, W.; Dousse, J.-Cl.; Hönicke, P.; Hoszowska, J.; Jabłoński, Ł.; Kayser, Y.; Kubala-Kukuś, A.; Pajek, M.; Reinhardt, F.; Savu, A.V.; Szlachetko, J.

2014-01-01

Various 3-dimensional nano-scaled periodic structures with different configurations and periods deposited on the surface of silicon and silica substrates were investigated by means of the grazing incidence and grazing emission X-ray fluorescence techniques. Apart from the characteristics which are typical for particle- and layer-like samples, the measured angular intensity profiles show additional periodicity-related features. The latter could be explained by a novel theoretical approach based on simple geometrical optics (GO) considerations. The new GO-based calculations were found to yield results in good agreement with experiment, also in cases where other theoretical approaches are not valid, e.g., periodic particle distributions with an increased surface coverage

Investigation of multilayered nanocomposites as low energy X-Rays attenuators

Energy Technology Data Exchange (ETDEWEB)

Silva, Liliane; Batista, Adriana S.M.; Nascimento, Jefferson P.; Furtado, Clascídia A.; Faria, Luiz O., E-mail: asfisica@gmail.com, E-mail: adriananuclear@yahoo.com.br, E-mail: farialo@cdtn.br, E-mail: nascimentopatricio@yahoo.com.br, E-mail: clas@cdtn.br [Universidade Federal de Minas Gerais (UFMG), Belo Horizonte, MG (Brazil); Centro de Desenvolvimento da Tecnologia Nuclear (CDTN/CNEN-MG), Belo Horizonte, MG (Brazil)

2017-11-01

The development of radiation attenuating materials has application in radioprotection and conditioning of short-lived waste. Polymeric materials can serve as a matrix for the dispersion of nanomaterials with good attenuation features, resulting in lightweight, conformable, flexible and easy-to-process materials. Thus, some well-known shielding materials could be used in low proportion for the formation of new materials. On the other hand, nanostructured carbon materials, such as graphene oxide (GO) and carbon nanotubes (NTCs), have been reported recently to show enhanced attenuation properties. In this sense, polymeric matrixes provide the necessary flexibility for use in various applications that require molding. For the present work, poly(vinylidene fluoride) [PVDF] homopolymers and its fluorinated copolymers were filled with nanosized metallic and graphene oxides in order to produce nanocomposites with increased low energy X-ray attenuation efficiency. Film samples of PVDF/reduced Graphene Oxide [PVDF/rGO] and Poly(vinylidene fluoride – tryfluorethylene)/Barium Oxide [P(VDF-TrFE)/BaO] were synthesized. In a second step, the samples were then sandwiched between Kapton® layers and exposed to X-rays source (8.5 keV). The samples were characterized with Scanning Electron Microscopy (SEM) and Energy Dispersive Spectroscopy (EDS). The attenuation coefficient was evaluated and compared with the attenuation of the individual constituents. It was observed an increase in the linear attenuation coefficient of the layered materials, justifying further investigation of these nanostructured composites as X-ray or gamma radiation attenuators. (author)

Investigation of multilayered nanocomposites as low energy X-Rays attenuators

International Nuclear Information System (INIS)

Silva, Liliane; Batista, Adriana S.M.; Nascimento, Jefferson P.; Furtado, Clascídia A.; Faria, Luiz O.

2017-01-01

The development of radiation attenuating materials has application in radioprotection and conditioning of short-lived waste. Polymeric materials can serve as a matrix for the dispersion of nanomaterials with good attenuation features, resulting in lightweight, conformable, flexible and easy-to-process materials. Thus, some well-known shielding materials could be used in low proportion for the formation of new materials. On the other hand, nanostructured carbon materials, such as graphene oxide (GO) and carbon nanotubes (NTCs), have been reported recently to show enhanced attenuation properties. In this sense, polymeric matrixes provide the necessary flexibility for use in various applications that require molding. For the present work, poly(vinylidene fluoride) [PVDF] homopolymers and its fluorinated copolymers were filled with nanosized metallic and graphene oxides in order to produce nanocomposites with increased low energy X-ray attenuation efficiency. Film samples of PVDF/reduced Graphene Oxide [PVDF/rGO] and Poly(vinylidene fluoride – tryfluorethylene)/Barium Oxide [P(VDF-TrFE)/BaO] were synthesized. In a second step, the samples were then sandwiched between Kapton® layers and exposed to X-rays source (8.5 keV). The samples were characterized with Scanning Electron Microscopy (SEM) and Energy Dispersive Spectroscopy (EDS). The attenuation coefficient was evaluated and compared with the attenuation of the individual constituents. It was observed an increase in the linear attenuation coefficient of the layered materials, justifying further investigation of these nanostructured composites as X-ray or gamma radiation attenuators. (author)

Single atom identification by energy dispersive x-ray spectroscopy

International Nuclear Information System (INIS)

Lovejoy, T. C.; Dellby, N.; Krivanek, O. L.; Ramasse, Q. M.; Falke, M.; Kaeppel, A.; Terborg, R.; Zan, R.

2012-01-01

Using aberration-corrected scanning transmission electron microscope and energy dispersive x-ray spectroscopy, single, isolated impurity atoms of silicon and platinum in monolayer and multilayer graphene are identified. Simultaneously acquired electron energy loss spectra confirm the elemental identification. Contamination difficulties are overcome by employing near-UHV sample conditions. Signal intensities agree within a factor of two with standardless estimates.

High-resolution x-ray imaging of planar foils irradiated by the Nike KrF laser

International Nuclear Information System (INIS)

Brown, C.; Seely, J.; Feldman, U.; Obenschain, S.; Bodner, S.; Pawley, C.; Gerber, K.; Sethian, J.; Mostovych, A.; Aglitskiy, Y.; Lehecka, T.; Holland, G.

1997-01-01

Thin plastic (CH) foils were irradiated by the Naval Research Laboratory Nike [Obenschain et al., Phys. Plasmas 3, 2098 (1996)] KrF laser and were imaged in the x-ray and extreme ultraviolet regions with two-dimensional spatial resolution in the 3 endash 10 μm range. The CH foils were backlit by a silicon plasma. A spherically curved quartz crystal produced monochromatic images of the Si +12 resonance line radiation with energy 1865 eV that was transmitted by the CH foils. Instabilities that were seeded by linear ripple patterns on the irradiated sides of CH foils were observed. The ripple patterns had periods in the 31 endash 125 μm range and amplitudes in the 0.25 endash 5.0 μm range. The silicon backlighter emission was recorded by an x-ray spectrometer, and the 1865 eV resonance line emission was recorded by a fast x-ray diode. The multilayer mirror telescope recorded images of the C +3 1550 Angstrom emission (energy 8.0 eV) from the backside of the CH foils. copyright 1997 American Institute of Physics

Development of a Wolter Optic X-ray Imager on Z

Science.gov (United States)

Fein, Jeffrey R.; Ampleford, David J.; Vogel, Julia K.; Kozioziemski, Bernie; Walton, Christopher C.; Wu, Ming; Ayers, Jay; Ball, Chris J.; Bourdon, Chris J.; Maurer, Andrew; Pivovaroff, Mike; Ramsey, Brian; Romaine, Suzanne

2017-10-01

A Wolter optic x-ray imager is being developed for the Z Machine to study the dynamics of warm x-ray sources with energies above 10 keV. The optic is adapted from observational astronomy and uses multilayer-coated, hyperbolic and parabolic x-ray mirrors to form a 2D image with predicted 100- μm resolution over a 5x5-mm field of view. The imager is expected to have several advantages over a simple pinhole camera. In particular, it can form quasi mono-energetic images due to the inherent band-pass nature of the x-ray mirrors from Bragg diffraction. As well, its larger collection solid angle can lead to an overall increase in efficiency for the x-rays in the desirable energy band. We present the design of the imaging system, which is initially optimized to view Mo K-alpha x-rays (17.5 keV). In addition, we will present preliminary measurements of the point-spread function as well as the spectral sensitivity of the instrument. Sandia National Laboratories is a multimission laboratory managed and operated by NTESS, LLC., a wholly owned subsidiary of Honeywell International, Inc., for the U.S. DOE's NNSA under contract DE-NA-0003525.

Electron-probe microanalysis: x-ray spectroscopy

International Nuclear Information System (INIS)

1987-01-01

The main principles on X-ray, energy and wave length dispersive spectroscopy are reviewed. In order to allow the choice of the best operating conditions, the importance of the regulation and control systems is underlined. Emission theory, X-rays nature and its interaction with matter and electrons in the matter is shown. The structure, operating procedures and necessary electronics (single channel - analysis chain) automatic-control system for the threshold-energies discrimination and the energy distribution visualization) associated to the wavelength dispersive spectroscopy are described. The focusing control, resolution, influence of chemical bonds and multilayer-structure monochromators relaled to wavelength dispersive spectroscopy are studied. Concerning the energy-dispersive spectroscopy, the detector, preamplifier, amplifier, analog-digital converter, as well as the utilization and control of the spectrometer are described. Problems and instrumental progress on energy-dispersive spectroscopy related to the electronic-noise control, charge collection and light-elements detection are discussed [fr

Two methods for studying the X-ray variability

NARCIS (Netherlands)

Yan, Shu-Ping; Ji, Li; Méndez, Mariano; Wang, Na; Liu, Siming; Li, Xiang-Dong

2016-01-01

The X-ray aperiodic variability and quasi-periodic oscillation (QPO) are the important tools to study the structure of the accretion flow of X-ray binaries. However, the origin of the complex X-ray variability from X-ray binaries remains yet unsolved. We proposed two methods for studying the X-ray

Applications of simultaneous ion backscattering and ion-induced x-ray emission

International Nuclear Information System (INIS)

Musket, R.G.

1983-05-01

Simultaneous ion backscattering and ion-induced x-ray emission (E/sub x/greater than or equal to 300 eV) analyses have been performed using helium ions as probes of the first few hundred nanometers of various materials. These studies serve as a demonstration of the complementary nature of the two types of information obtained. Uncertainties associated with each of the individual techniques were reduced by performing both analyses. The principal advantages of simultaneous analyses over sequential analyses have been delineated

Sample preparation of energy materials for X-ray nanotomography with micromanipulation.

Science.gov (United States)

Chen-Wiegart, Yu-chen Karen; Camino, Fernando E; Wang, Jun

2014-06-06

X-ray nanotomography presents an unprecedented opportunity to study energy storage/conversion materials at nanometer scales in three dimensions, with both elemental and chemical sensitivity. A critical step in obtaining high-quality X-ray nanotomography data is reliable sample preparation to ensure that the entire sample fits within the field of view of the X-ray microscope. Although focused-ion-beam lift-out has previously been used for large sample (few to tens of microns) preparation, a difficult undercut and lift-out procedure results in a time-consuming sample preparation process. Herein, we propose a much simpler and direct sample preparation method to resolve the issues that block the view of the sample base after milling and during the lift-out process. This method is applied on a solid-oxide fuel cell and a lithium-ion battery electrode, before numerous critical 3D morphological parameters are extracted, which are highly relevant to their electrochemical performance. A broad application of this method for microstructure study with X-ray nanotomography is discussed and presented. © 2014 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Quasi-periodic oscillations and noise in low-mass X-ray binaries

International Nuclear Information System (INIS)

Van der Klis, M.

1989-01-01

The phenomenology of quasi-periodic oscillations (QPOs) and noise in low-mass X-ray binaries (LMXBs) is discussed. Signal analysis aspects of QPO and noise are addressed along with the relationship between LMXBs and millisecond radio pulsars. The history and prehistory of QPOs and noise in LMXBs are examined. Universal noise components and normal and flaring branch QPOs in Z sources are described and the phenomenology of Z sources is discussed. Bright LMXBs known as atoll sources are considered, as are nonpersistently bright LMXBs accreting pulsars and black hole candidates. 162 refs

A periodicity of approximately 1 hour in X-ray emission from the active galaxy RE J1034+396.

Science.gov (United States)

Gierliński, Marek; Middleton, Matthew; Ward, Martin; Done, Chris

2008-09-18

Active galactic nuclei and quasars are thought to be scaled-up versions of Galactic black hole binaries, powered by accretion onto supermassive black holes with masses of 10(6)-10(9) M[symbol: see text], as opposed to the approximately 10 M [symbol: see text] in binaries (here M [symbol: see text] is the solar mass). One example of the similarities between these two types of systems is the characteristic rapid X-ray variability seen from the accretion flow. The power spectrum of this variability in black hole binaries consists of a broad noise with multiple quasi-periodic oscillations superimposed on it. Although the broad noise component has been observed in many active galactic nuclei, there have hitherto been no significant detections of quasi-periodic oscillations. Here we report the discovery of an approximately 1-hour X-ray periodicity in a bright active galaxy, RE J1034+396. The signal is highly statistically significant (at the 5.6 sigma level) and very coherent, with quality factor Q > 16. The X-ray modulation arises from the direct vicinity of the black hole.

Rocket Experiment Demonstration of a Soft X-ray Polarimeter

Science.gov (United States)

Marshall, Herman

This proposal is the lead proposal. Boston University will submit, via NSPIRES, a Co-I proposal, per instructions for Suborbital proposals for multiple-award. Our scientific goal of the Rocket Experiment Demonstration of a Soft X-ray Polarimeter (REDSoX Polarimeter) is to make the first measurement of the linear X-ray polarization of an extragalactic source in the 0.2-0.8 keV band. The first flight of the REDSoX Polarimeter would target Mk 421, which is commonly modeled as a highly relativistic jet aimed nearly along the line of sight. Such sources are likely to be polarized at a level of 30-60%, so the goal is to obtain a significant detection even if it is as low as 10%. Significant revisions to the models of jets emanating from black holes at the cores of active galaxies would be required if the polarization fraction lower than 10%. We employ multilayer-coated mirrors as Bragg reflectors at the Brewster angle. By matching to the dispersion of a spectrometer, one may take advantage of high multilayer reflectivities and achieve polarization modulation factors over 90%. Using replicated foil mirrors from MSFC and gratings made at MIT, we construct a spectrometer that disperses to three laterally graded multilayer mirrors (LGMLs). The lateral grading changes the wavelength of the Bragg peak for 45 degree reflections linearly across the mirror, matching the dispersion of the spectrometer. By dividing the entrance aperture into six equal sectors, pairs of blazed gratings from opposite sectors are oriented to disperse to the same LGML. The position angles for the LGMLs are 120 degrees to each other. CCD detectors then measure the intensities of the dispersed spectra after reflection and polarizing by the LGMLs, giving the three Stokes parameters needed to determine the source polarization. We will rely on components whose performance has been verified in the laboratory or in space. The CCD detectors are based on Chandra and Suzaku heritage. The mirror fabrication team

Control console for the X-ray room

International Nuclear Information System (INIS)

Garcia H, J.M.; Aguilar B, M.A.; Torres B, M.A.

1998-01-01

It is presented the design and construction of Control console for the X-ray room of Metrology Center for ionizing radiations at National Institute of Nuclear Research (ININ). This system controls the positioning of 6 different filters for an X-ray beam. Also it controls a shutter which blockades the beam during periods established by user, these periods can be fixed from hours until tenth of second. The shutter opening periods, as well as the X-ray beam filter are establish and monitoring from a Personal computer outside of room. (Author)

Characterization of molybdenum/silicon X-ray multilayers

CERN Document Server

Nayak, M; Lodha, G S; Shrivastava, A K; Tripathi, P; Sinha, A K; Sawhney, K J S; Nandedkar, R V

2003-01-01

Mo/Si multilayers (MLs) with variable Mo thickness were fabricated using electron beam evaporator. Percolation thickness for Mo was determined experimentally. MLs with Mo thickness below percolation show low reflectivity due to discontinuous nature of Mo film. As the number of layer pair increases, the interfacial roughness increases, due to increase in correlated roughness. Extreme ultra violet reflectivity was measured using synchrotron radiation. The fitting result reveals that the graded interface layer exists at each interface. Cross-sectional transmission electron microscopy has been done on some of these MLs.

Fabrication of customizable wedged multilayer Laue lenses by adding a stress layer

International Nuclear Information System (INIS)

Niese, Sven; Krüger, Peter; Kubec, Adam; Laas, Roman; Gawlitza, Peter; Melzer, Kathleen; Braun, Stefan; Zschech, Ehrenfried

2014-01-01

Diffractive optics for hard X-rays feature superior properties in terms of resolution and efficiency, if volume diffraction effects are exploited all-over the aperture. For multilayer Laue lenses, preferably a wedged geometry is required to obtain this effect. We present an approach utilizing an additional stress layer to realize the necessary geometrical modifications where each lens can be customized to a selected photon energy independently of the given multilayer deposition. The quality of the deposition of the stress layer is evaluated using a laboratory X-ray microscope prior to its application at synchrotron radiation facilities with a special approach to measure the relative layer tilt at high spatial resolution. - Highlights: • Wedged multilayer Laue lenses were fabricated using an additional stress layer. • Each lens can be customized to any photon energy independently of the multilayer. • The relative layer tilt is measured using laboratory X-ray microscopy

Raman scattering and x-ray diffractometry studies of epitaxial TiO2 and VO2 thin films and multilayers on α-Al2O3(11 bar 20)

International Nuclear Information System (INIS)

Foster, C.M.; Chiarello, R.P.; Chang, H.L.M.; You, H.; Zhang, T.J.; Frase, H.; Parker, J.C.; Lam, D.J.

1993-01-01

Epitaxial thin films of TiO 2 and VO 2 single layers and TiO 2 /VO 2 multilayers were grown on (11 bar 20) sapphire (α-Al 2 O 3 ) substrates using the metalorganic chemical vapor deposition technique and were characterized using Raman scattering and four x-ray diffractometry. X-ray diffraction results indicate that the films are high quality single crystal material with well defined growth plane and small in-plane and out-of-plane mosaic. Single-layer films are shown to obey the Raman selection rules of TiO 2 and VO 2 single crystals. The close adherence to the Raman selection rules indicates the high degree of orientation of the films, both parallel and perpendicular to the growth plane. Selection rule spectra of two and three layer TiO 2 /VO 2 multilayers are dominated by the VO 2 layers with only minimal signature of the TiO 2 layers. Due to the low band gap of semiconducting vanadium dioxide, we attribute the strong signature of the VO 2 layers to resonant enhancement of the VO 2 Raman component accompanied with absorption of the both the incident and scattered laser light from the TiO 2 layers

Optical technologies for extreme-ultraviolet and soft X-ray coherent sources

International Nuclear Information System (INIS)

Canova, Federico; Poletto, Luca

2015-01-01

The book reviews the most recent achievements in optical technologies for XUV and X-ray coherent sources. Particular attention is given to free-electron-laser facilities, but also to other sources available at present, such as synchrotrons, high-order laser harmonics and X-ray lasers. The optical technologies relevant to each type of source are discussed. In addition, the main technologies used for photon handling and conditioning, namely multilayer mirrors, adaptive optics, crystals and gratings are explained. Experiments using coherent light received during the last decades a lot of attention for the X-ray regime. Strong efforts were taken for the realization of almost fully coherent sources, e.g. the free-electron lasers, both as independent sources in the femtosecond and attosecond regimes and as seeding sources for free-electron-lasers and X-ray gas lasers. In parallel to the development of sources, optical technologies for photon handling and conditioning of such coherent and intense X-ray beams advanced. New problems were faced for the realization of optical components of beamlines demanding to manage coherent X-ray photons, e.g. the preservation of coherence and time structure of ultra short pulses.

Direct intensity calibration of X-ray grazing-incidence microscopes with home-lab source

Science.gov (United States)

Li, Yaran; Xie, Qing; Chen, Zhiqiang; Xin, Qiuqi; Wang, Xin; Mu, Baozhong; Wang, Zhanshan; Liu, Shenye; Ding, Yongkun

2018-01-01

Direct intensity calibration of X-ray grazing-incidence microscopes is urgently needed in quantitative studies of X-ray emission from laser plasma sources in inertial confinement fusion. The existing calibration methods for single reflecting mirrors, crystals, gratings, filters, and X-ray detectors are not applicable for such X-ray microscopes due to the specific optical structure and the restrictions of object-image relation. This article presents a reliable and efficient method that can be performed using a divergent X-ray source and an energy dispersive Si-PIN (silicon positive-intrinsic-negative) detector in an ordinary X-ray laboratory. The transmission theory of X-ray flux in imaging diagnostics is introduced, and the quantities to be measured are defined. The calibration method is verified by a W/Si multilayer-coated Kirkpatrick-Baez microscope with a field of view of ˜95 μm at 17.48 keV. The mirror reflectance curve in the 1D coordinate is drawn with a peak value of 20.9% and an uncertainty of ˜6.0%.

Structure, phase composition and microhardness of vacuum-arc multilayered Ti/Al, Ti/Cu, Ti/Fe, Ti/Zr nano-structures with different periods

Energy Technology Data Exchange (ETDEWEB)

Demchishin, A.V., E-mail: ademch@meta.ua [Institute of Problems in Material Science, NASU, Kiev (Ukraine); Gnilitskyi, I., E-mail: iaroslav.gnilitskyi@unimore.it [DISMI – Department of Sciences and Methods for Engineering, University of Modena and Reggio Emilia, Reggio Emilia (Italy); Orazi, L., E-mail: leonardo.orazi@unimore.it [DISMI – Department of Sciences and Methods for Engineering, University of Modena and Reggio Emilia, Reggio Emilia (Italy); Ascari, A., E-mail: a.ascari@unibo.it [DIN – Department of Industrial Engineering, University of Bologna, Bologna (Italy)

2015-07-01

Highlights: • Multilayer coatings of Ti/Fe, Ti/Al, Ti/Cu and Ti/Zr are generated. • Microstructure and morphology of the different systems are investigated. • XR diffraction analysis was performed to investigate phases composition. • Effects of inter metallic phases on microhardess are investigated. • Correlations between parameters and layer thickness are outlined. - Abstract: The microstructure, phase composition and microhardness of multilayered Ti/Al, Ti/Cu, Ti/Fe and Ti/Zr condensates produced on stainless steel substrates via vacuum-arc evaporation of pure metals were studied. The sublayer periods (Λ) were regulated in the range 80–850 nm by varying the vacuum discharge current and the duration of the successive depositions of metallic plasma onto the substrates while maintaining the total deposition time constant. The regularity of the obtained nanostructures was investigated by scanning and transmission electron microscopy while phase compositions were identified with X-ray diffraction (XRD) analysis in order to evidence the presence of interdiffusion and the amount of intermetallics. Condensates cross sections were mechanically characterized by means of microhardness tests. Measurements were correlated to the periods and to the presence of intermetallics.

Structure, phase composition and microhardness of vacuum-arc multilayered Ti/Al, Ti/Cu, Ti/Fe, Ti/Zr nano-structures with different periods

International Nuclear Information System (INIS)

Demchishin, A.V.; Gnilitskyi, I.; Orazi, L.; Ascari, A.

2015-01-01

Highlights: • Multilayer coatings of Ti/Fe, Ti/Al, Ti/Cu and Ti/Zr are generated. • Microstructure and morphology of the different systems are investigated. • XR diffraction analysis was performed to investigate phases composition. • Effects of inter metallic phases on microhardess are investigated. • Correlations between parameters and layer thickness are outlined. - Abstract: The microstructure, phase composition and microhardness of multilayered Ti/Al, Ti/Cu, Ti/Fe and Ti/Zr condensates produced on stainless steel substrates via vacuum-arc evaporation of pure metals were studied. The sublayer periods (Λ) were regulated in the range 80–850 nm by varying the vacuum discharge current and the duration of the successive depositions of metallic plasma onto the substrates while maintaining the total deposition time constant. The regularity of the obtained nanostructures was investigated by scanning and transmission electron microscopy while phase compositions were identified with X-ray diffraction (XRD) analysis in order to evidence the presence of interdiffusion and the amount of intermetallics. Condensates cross sections were mechanically characterized by means of microhardness tests. Measurements were correlated to the periods and to the presence of intermetallics

Speckle-based at-wavelength metrology of x-ray optics at Diamond Light Source

Science.gov (United States)

Wang, Hongchang; Zhou, Tunhe; Kashyap, Yogesh; Sawhney, Kawal

2017-08-01

To achieve high resolution and sensitivity on the nanometer scale, further development of X-ray optics is required. Although ex-situ metrology provides valuable information about X-ray optics, the ultimate performance of X-ray optics is critically dependent on the exact nature of the working conditions. Therefore, it is equally important to perform in-situ metrology at the optics' operating wavelength (`at-wavelength' metrology) to optimize the performance of X-ray optics and correct and minimize the collective distortions of the upstream beamline optics, e.g. monochromator, windows, etc. Speckle-based technique has been implemented and further improved at Diamond Light Source. We have demonstrated that the angular sensitivity for measuring the slope error of an optical surface can reach an accuracy of two nanoradians. The recent development of the speckle-based at-wavelength metrology techniques will be presented. Representative examples of the applications of the speckle-based technique will also be given - including optimization of X-ray mirrors and characterization of compound refraction lenses. Such a high-precision metrology technique will be extremely beneficial for the manufacture and in-situ alignment/optimization of X-ray mirrors for next-generation synchrotron beamlines.

Periodicities in the high-mass X-ray binary system RXJ0146.9+6121/LSI+61°235

Science.gov (United States)

Sarty, Gordon E.; Kiss, László L.; Huziak, Richard; Catalan, Lionel J. J.; Luciuk, Diane; Crawford, Timothy R.; Lane, David J.; Pickard, Roger D.; Grzybowski, Thomas A.; Closas, Pere; Johnston, Helen; Balam, David; Wu, Kinwah

2009-01-01

The high-mass X-ray binary RXJ0146.9+6121, with optical counterpart LSI+61°235 (V831Cas), is an intriguing system on the outskirts of the open cluster NGC663. It contains the slowest Be type X-ray pulsar known with a pulse period of around 1400s and, primarily from the study of variation in the emission line profile of Hα, it is known to have a Be decretion disc with a one-armed density wave period of approximately 1240d. Here we present the results of an extensive photometric campaign, supplemented with optical spectroscopy, aimed at measuring short time-scale periodicities. We find three significant periodicities in the photometric data at, in order of statistical significance, 0.34, 0.67 and 0.10d. We give arguments to support the interpretation that the 0.34 and 0.10d periods could be due to stellar oscillations of the B-type primary star and that the 0.67d period is the spin period of the Be star with a spin axis inclination of 23+10-8 degrees. We measured a systemic velocity of -37.0 +/- 4.3kms-1 confirming that LSI+61°235 has a high probability of membership in the young cluster NGC663 from which the system's age can be estimated as 20-25Myr. From archival RXTE All Sky Monitor (ASM) data we further find `super' X-ray outbursts roughly every 450d. If these super outbursts are caused by the alignment of the compact star with the one-armed decretion disc enhancement, then the orbital period is approximately 330d.

Superorbital Period in the high mass X-ray binary 2S 0114+650

Science.gov (United States)

Farrell, S.; Sood, R.; O'Neill, P.

2004-05-01

We report the identification of a superorbital period in the high mass X-ray binary 2S 0114+650. RXTE ASM observations of this object from 1996 Jan 5 to 2003 May 26 show the presence of a modulation at a period of 30.7 +/- 0.2 days. This period is detected using a Lomb-Scargle periodogram, and has a false-alarm probability of 5E-12. Epoch folding of the data gives an ephemeris of JD 2450079.4 (+/- 0.7) +30.7 (+/- 0.2)N, where N is the cycle number, with phase zero defined as the modulation minimum, and a full amplitude of 60 +/- 20%.

Very high resolution UV and X-ray spectroscopy and imagery of solar active regions

Science.gov (United States)

Bruner, M.; Brown, W. A.; Haisch, B. M.

1987-01-01

A scientific investigation of the physics of the solar atmosphere, which uses the techniques of high resolution soft X-ray spectroscopy and high resolution UV imagery, is described. The experiments were conducted during a series of three sounding rocket flights. All three flights yielded excellent images in the UV range, showing unprecedented spatial resolution. The second flight recorded the X-ray spectrum of a solar flare, and the third that of an active region. A normal incidence multi-layer mirror was used during the third flight to make the first astronomical X-ray observations using this new technique.

Portable mini-chamber for temperature dependent studies using small angle and wide angle x-ray scattering

Science.gov (United States)

Dev, Arun Singh; Kumar, Dileep; Potdar, Satish; Pandit, Pallavi; Roth, Stephan V.; Gupta, Ajay

2018-04-01

The present work describes the design and performance of a vacuum compatible portable mini chamber for temperature dependent GISAXS and GIWAXS studies of thin films and multilayer structures. The water cooled body of the chamber allows sample annealing up to 900 K using ultra high vacuum compatible (UHV) pyrolytic boron nitride heater, thus making it possible to study the temperature dependent evolution of structure and morphology of two-dimensional nanostructured materials. Due to its light weight and small size, the chamber is portable and can be accommodated at synchrotron facilities worldwide. A systematic illustration of the versatility of the chamber has been demonstrated at beamline P03, PETRA-III, DESY, Hamburg, Germany. Temperature dependent grazing incidence small angle x-ray scattering (GISAXS) and grazing incidence wide angle x-ray scattering (GIWAXS) measurements were performed on oblique angle deposited Co/Ag multilayer structure, which jointly revealed that the surface diffusion in Co columns in Co/Ag multilayer enhances by increasing temperature from RT to ˜573 K. This results in a morphology change from columnar tilted structure to densely packed morphological isotropic multilayer.

X-ray Spectroscopic Characterization of Shock-Ignition-Relevant plasmas

Directory of Open Access Journals (Sweden)

Michal Šmíd

2013-01-01

Full Text Available Experiments with multilayer plastic/Cu targets performed at a PALS laser system aimed at the study of matter at conditions relevant to a shock ignition ICF scheme, and, in particular, at the investigation of hot electrons generation. Plasma temperature and density were obtained using high-resolution X-ray spectroscopy. 2D-spatially resolved quasi–monochromatic imaging was observing the hot electrons via fluorescence K emission in the copper tracer layer. Found values of plasma temperature 690 ± 10 eV, electron density 3 × 1022 cm-3 and the effective energy of hot electrons 45 ± 20 keV demonstrate the potential of X-ray methods in the characterization of the shock ignition environmental conditions.

Preparation, characterization and optical properties of Lanthanum-(nanometer MCM-41) composite materials

International Nuclear Information System (INIS)

Zhai, Q. Z.; Wang, P.

2008-01-01

Nanometer MCM-41 molecular sieve was prepared under a base condition by using cetyltrimethylammonium bromide as template and tetraethyl orthosilicate as silica source by means of hydrothermal method. Lanthanum(III) was incorporated into the nanometer MCM-41 by a liquid phase grafting method. The prepared nano composite materials were characterized by means of powder X-ray diffraction, spectrophotometric analysis, Fourier transform infrared spectroscopy, low temperature nitrogen adsorption-desorption technique, solid diffuse reflectance absorption spectra and luminescence. The powder X-ray diffraction studies show that the nanometer MCM-41 molecular sieve is successfully prepared. The highly ordered meso porous two-dimensional hexagonal channel structure and framework of the support MCM-41 is retained intact in the prepared composite material La-(nanometer MCM-41). The spectrophotometric analysis indicates that lanthanum exists in the prepared nano composite materials. The Fourier transform infrared spectra indicate that the framework of the MCM-41 molecular sieve still remains in the prepared nano composite materials and some framework vibration peaks show blue shifts relative to those of the MCM-41 molecular sieve. The low temperature nitrogen adsorption-desorption indicates that the guest locales in the channel of the molecular sieve. Compared with bulk lanthanum oxide, the guest in the channel of the molecular sieve has smaller particle size and shows a significant blue shift of optical absorption band in solid diffuse reflectance absorption spectra. The observed blue shift in the solid state diffuse reflectance absorption spectra of the lanthanum-(nanometer MCM-41) sample show the obvious stereoscopic confinement effect of the channel of the host on the guest, which further indicates the successful encapsulation of the guest in the host. The La-(nanometer MCM-41) sample shows luminescence

Ten years of Vela x-ray observations

International Nuclear Information System (INIS)

Terrell, J.; Priedhorsky, W.C.

1983-01-01

The Vela spacecraft, particularly Vela 5B, produced all-sky X-ray data of unprecedented length and completeness. The data led to the discovery of X-ray bursts and numerous transient outbursts. Recent re-analysis has put the data in the form of 10-day skymaps covering a 7-year period, which have led to the discovery or confirmation of a number of long-term periodicities, and have made possible a time-lapse movie of the X-ray sky

High resolution x-ray lensless imaging by differential holographic encoding

Energy Technology Data Exchange (ETDEWEB)

Zhu, D.; Guizar-Sicairos, M.; Wu, B.; Scherz, A.; Acremann, Y.; Tylisczcak, T.; Fischer, P.; Friedenberger, N.; Ollefs, K.; Farle, M.; Fienup, J. R.; Stohr, J.

2009-11-02

X-ray free electron lasers (X-FEL{sub s}) will soon offer femtosecond pulses of laterally coherent x-rays with sufficient intensity to record single-shot coherent scattering patterns for nanoscale imaging. Pulse trains created by splitand-delay techniques even open the door for cinematography on unprecedented nanometer length and femtosecond time scales. A key to real space ultrafast motion pictures is fast and reliable inversion of the recorded reciprocal space scattering patterns. Here we for the first time demonstrate in the x-ray regime the power of a novel technique for lensless high resolution imaging, previously suggested by Guizar-Sicairos and Fienup termed holography with extended reference by autocorrelation linear differential operation, HERALD0. We have achieved superior resolution over conventional x-ray Fourier transform holography (FTH) without sacrifices in SNR or significant increase in algorithmic complexity. By combining images obtained from individual sharp features on an extended reference, we further show that the resolution can be even extended beyond the reference fabrication limits. Direct comparison to iterative phase retrieval image reconstruction and images recorded with stateof- the-art zone plate microscopes is presented. Our results demonstrate the power of HERALDO as a favorable candidate for robust inversion of single-shot coherent scattering patterns.

High-Resolution X-Ray Lensless Imaging by Differential Holographic Encoding

Energy Technology Data Exchange (ETDEWEB)

Zhu, Diling [Stanford Univ., CA (United States). Dept. of Applied Physics; SLAC National Accelerator Lab., Menlo Park, CA (United States). Stanford Inst. for Material and Energy Science; Guizar-Sicairos, Manuel [Univ. of Rochester, NY (United States). Inst. of Optics; Wu, Benny [Stanford Univ., CA (United States). Dept. of Applied Physics; SLAC National Accelerator Lab., Menlo Park, CA (United States). Stanford Inst. for Material and Energy Science; Scherz, Andreas [SLAC National Accelerator Lab., Menlo Park, CA (United States). Stanford Inst. for Material and Energy Science; Acremann, Yves [SLAC National Accelerator Lab., Menlo Park, CA (United States). Photon Ultrafast Laser Science and Engineering Inst. (PULSE); Tyliszczak, Tolek [Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source (ALS); Fischer, Peter [Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Center for X-ray Optics; Friedenberger, Nina [Universitat Duisburg-Essen (Germany). Dept. of Physics and Center for Nanointegration Duisburg-Essen (CeNIDE); Ollefs, Katharina [Universitat Duisburg-Essen (Germany). Dept. of Physics and Center for Nanointegration Duisburg-Essen (CeNIDE); Farle, Michael [Universitat Duisburg-Essen (Germany). Dept. of Physics and Center for Nanointegration Duisburg-Essen (CeNIDE); Fienup, James R. [Univ. of Rochester, NY (United States). Inst. of Optics; Stöhr, Joachim [SLAC National Accelerator Lab., Menlo Park, CA (United States). Linac Coherent Light Source (LCLS)

2010-07-01

X-ray free electron lasers (X-FELs) will soon offer femtosecond pulses of laterally coherent x-rays with sufficient intensity to record single-shot coherent scattering patterns for nanoscale imaging. Pulse trains created by split and- delay techniques even open the door for cinematography on unprecedented nanometer length and femtosecond time scales. A key to real space ultrafast motion pictures is fast and reliable inversion of the recorded reciprocal space scattering patterns. Here we for the first time demonstrate in the x-ray regime the power of a novel technique for lensless high resolution imaging, previously suggested by Guizar-Sicairos and Fienup termed holography with extended reference by autocorrelation linear differential operation, HERALD0. We have achieved superior resolution over conventional x-ray Fourier transform holography (FTH) without sacrifices in SNR or significant increase in algorithmic complexity. By combining images obtained from individual sharp features on an extended reference, we further show that the resolution can be even extended beyond the reference fabrication limits. Direct comparison to iterative phase retrieval image reconstruction and images recorded with state of-the-art zone plate microscopes is presented. Our results demonstrate the power of HERALDO as a favorable candidate for robust inversion of single-shot coherent scattering patterns.

High performance EUV multilayer structures insensitive to capping layer optical parameters.

Science.gov (United States)

Pelizzo, Maria Guglielmina; Suman, Michele; Monaco, Gianni; Nicolosi, Piergiorgio; Windt, David L

2008-09-15

We have designed and tested a-periodic multilayer structures containing protective capping layers in order to obtain improved stability with respect to any possible changes of the capping layer optical properties (due to oxidation and contamination, for example)-while simultaneously maximizing the EUV reflection efficiency for specific applications, and in particular for EUV lithography. Such coatings may be particularly useful in EUV lithographic apparatus, because they provide both high integrated photon flux and higher stability to the harsh operating environment, which can affect seriously the performance of the multilayer-coated projector system optics. In this work, an evolutive algorithm has been developed in order to design these a-periodic structures, which have been proven to have also the property of stable performance with respect to random layer thickness errors that might occur during coating deposition. Prototypes have been fabricated, and tested with EUV and X-ray reflectometry, and secondary electron spectroscopy. The experimental results clearly show improved performance of our new a-periodic coatings design compared with standard periodic multilayer structures.

Direct observation and analysis of yolk-shell materials using low-voltage high-resolution scanning electron microscopy: Nanometal-particles encapsulated in metal-oxide, carbon, and polymer

Energy Technology Data Exchange (ETDEWEB)

Asahina, Shunsuke; Suga, Mitsuo; Takahashi, Hideyuki [JEOL Ltd., SM Business Unit, Tokyo (Japan); Young Jeong, Hu [Graduate School of EEWS, WCU/BK21+, KAIST, Daejeon 305-701 (Korea, Republic of); Galeano, Carolina; Schüth, Ferdi [Department of Heterogeneous Catalysis, Max-Planck-Institut für Kohlenforschung, Mülheim (Germany); Terasaki, Osamu, E-mail: terasaki@mmk.su.se, E-mail: terasaki@kaist.ac.kr [Graduate School of EEWS, WCU/BK21+, KAIST, Daejeon 305-701 (Korea, Republic of); Department of Materials and Environmental Chemistry, Berzelii Centre EXSELENT on Porous Materials, Stockholm University, SE-10691 Stockholm (Sweden)

2014-11-01

Nanometal particles show characteristic features in chemical and physical properties depending on their sizes and shapes. For keeping and further enhancing their features, the particles should be protected from coalescence or degradation. One approach is to encapsulate the nanometal particles inside pores with chemically inert or functional materials, such as carbon, polymer, and metal oxides, which contain mesopores to allow permeation of only chemicals not the nanometal particles. Recently developed low-voltage high-resolution scanning electron microscopy was applied to the study of structural, chemical, and electron state of both nanometal particles and encapsulating materials in yolk-shell materials of Au@C, Ru/Pt@C, Au@TiO{sub 2}, and Pt@Polymer. Progresses in the following categories were shown for the yolk-shell materials: (i) resolution of topographic image contrast by secondary electrons, of atomic-number contrast by back-scattered electrons, and of elemental mapping by X-ray energy dispersive spectroscopy; (ii) sample preparation for observing internal structures; and (iii) X-ray spectroscopy such as soft X-ray emission spectroscopy. Transmission electron microscopy was also used for characterization of Au@C.

Multilayer mirrors as power filters in insertion device beamlines

International Nuclear Information System (INIS)

Kortright, J.B.; DiGennaro, R.S.

1988-08-01

The power-filtering capabilities of multilayer band-pass x-ray mirrors relative to total reflection low-pass mirrors is presented. Results are based on calculations assuming proposed wiggler sources on the upcoming generation of low energy (1.5 GeV) and high energy (7.0 GeV) synchrotron radiation sources. Results show that multilayers out-perform total reflection mirrors in terms of reduction in reflected power by roughly an order of magnitude, with relatively small increases in total absorbed power and power density over total reflection mirrors, and with comparable reflected flux values. Various aspects of this potential application of multilayer x-ray optics are discussed. 13 refs., 3 figs., 1 tab

THE RADIATIVE X-RAY AND GAMMA-RAY EFFICIENCIES OF ROTATION-POWERED PULSARS

International Nuclear Information System (INIS)

Vink, Jacco; Bamba, Aya; Yamazaki, Ryo

2011-01-01

We present a statistical analysis of the X-ray luminosity of rotation-powered pulsars and their surrounding nebulae using the sample of Kargaltsev and Pavlov, and we complement this with an analysis of the γ-ray emission of Fermi-detected pulsars. We report a strong trend in the efficiency with which spin-down power is converted to X-ray and γ-ray emission with characteristic age: young pulsars and their surrounding nebulae are efficient X-ray emitters, whereas in contrast old pulsars are efficient γ-ray emitters. We divided the X-ray sample in a young (τ c 4 yr) and old sample and used linear regression to search for correlations between the logarithm of the X-ray and γ-ray luminosities and the logarithms of the periods and period derivatives. The X-ray emission from young pulsars and their nebulae are both consistent with L X ∝ P-dot 3 /P 6 . For old pulsars and their nebulae the X-ray luminosity is consistent with a more or less constant efficiency η≡L X / E-dot rot ∼8x10 -5 . For the γ-ray luminosity we confirm that L γ ∝ √E-dot rot . We discuss these findings in the context of pair production inside pulsar magnetospheres and the striped wind model. We suggest that the striped wind model may explain the similarity between the X-ray properties of the pulsar wind nebulae and the pulsars themselves, which according to the striped wind model may both find their origin outside the light cylinder, in the pulsar wind zone.

Women and x-rays

Energy Technology Data Exchange (ETDEWEB)

Dunkley, P A; Stewart, J H

1976-01-01

When a woman comes to an X-Ray Department it is usually necessary to know the present stage of her menstrual cycle. X-Rays may have an adverse effect on the embryo, especially in early pregnancy. However, exposure to X-Rays at any stage may be associated with a slightly increased incidence of malignant disease in childhood. The International Commission on Radiological Protection recommends that in women of child-bearing age (in some cases as young as 11 years), non-urgent diagnostic radiography be confined to the preovulatory phase of the menstrual cycle: that is, 14 days following the first day of the last menstrual period.

Technical Note : A direct ray-tracing method to compute integral depth dose in pencil beam proton radiography with a multilayer ionization chamber

NARCIS (Netherlands)

Farace, Paolo; Righetto, Roberto; Deffet, Sylvain; Meijers, Arturs; Vander Stappen, Francois

2016-01-01

Purpose: To introduce a fast ray-tracing algorithm in pencil proton radiography (PR) with a multilayer ionization chamber (MLIC) for in vivo range error mapping. Methods: Pencil beam PR was obtained by delivering spots uniformly positioned in a square (45x45 mm(2) field-of-view) of 9x9 spots capable

Growth and characterization of NixCu1-x alloy films, NixCu1-x/NiyCu1-y multilayers, and nanowires

International Nuclear Information System (INIS)

Kazeminezhad, I.

2001-12-01

It was found that it is possible to grow Ni x Cu 1-x alloy systems of arbitrary composition by electrodepositing well-defined sub-monolayer quantities of Ni and Cu in alternation using a new method based on that used previously to prepare potentiostatically deposited magnetic multilayers from a single sulphamate-based electrolyte. Following growth, the chemical composition of Ni x Cu 1-x alloy films was obtained by ZAF-corrected energy dispersive X-Ray (EDX) analysis and less than a 4% difference between the nominal and actual composition was observed. The structure of the films was investigated by high-angle X-ray diffractometry (HAXRD) and transmission electron microscopy (TEM). The films grown on polycrystalline Cu substrates had (100) texture, while those grown on Au-coated glass had (111) texture. Some evidence of Ni clustering was obtained by vibrating sample magnetometry (VSM). Self-organisation of the deposited metal was suggested for Ni potentials more positive than ∼-1.4V. The transition from a Ni/Cu multilayer to a Ni x Cu 1-x alloy was also studied and an interesting aspect, namely a plateau region in a plot of magnetisation as a function of Ni layer thickness was observed, suggesting a preferred Ni cluster size in these alloy films. Anisotropic magnetoresistance (AMR) of the films decreased with increasing Cu content at 300K and 77K. SQUID measurements for Ni 0.52 Cu 0.48 and Ni 0.62 CU 0.38 films showed that they become much more strongly ferromagnetic at low temperatures. Evidence for blocked -superparamagnetic behaviour above a blocking temperature (T B ) of the films was obtained from zero-field-cooled (ZFC) and field-cooled (FC) magnetic susceptibility measurements. Ni x Cu 1-x /Ni y Cu 1-y alloy/alloy multilayer films with short repeat distance were successfully fabricated using this method. Up to third order satellite peaks observed in HAXRD showed that the interface is sharp. Room temperature longitudinal magnetoresistance measurements showed

Application of ultra-small-angle X-ray scattering / X-ray photon correlation spectroscopy to relate equilibrium or non-equilibrium dynamics to microstructure

Science.gov (United States)

Allen, Andrew; Zhang, Fan; Levine, Lyle; Ilavsky, Jan

2013-03-01

Ultra-small-angle X-ray scattering (USAXS) can probe microstructures over the nanometer-to-micrometer scale range. Through use of a small instrument entrance slit, X-ray photon correlation spectroscopy (XPCS) exploits the partial coherence of an X-ray synchrotron undulator beam to provide unprecedented sensitivity to the dynamics of microstructural change. In USAXS/XPCS studies, the dynamics of local structures in a scale range of 100 nm to 1000 nm can be related to an overall hierarchical microstructure extending from 1 nm to more than 1000 nm. Using a point-detection scintillator mode, the equilibrium dynamics at ambient temperature of small particles (which move more slowly than nanoparticles) in aqueous suspension have been quantified directly for the first time. Using a USAXS-XPCS scanning mode for non-equilibrium dynamics incipient processes within dental composites have been elucidated, prior to effects becoming detectable using any other technique. Use of the Advanced Photon Source, an Office of Science User Facility operated for the United States Department of Energy (U.S. DOE) Office of Science by Argonne National Laboratory, was supported by the U.S. DOE under Contract No. DE-AC02-06CH11357.

X-ray interferometric Fourier holography

International Nuclear Information System (INIS)

Balyan, M.K.

2016-01-01

The X-ray interferometric Fourier holography is proposed and theoretically investigated. Fourier The X-ray interferometric Young fringes and object image reconstruction are investigated. It is shown that the interference pattern of two slits formed on the exit surface of the crystal-analyzer (the third plate of the interferometer) is the X-ray interferometric Young fringes. An expression for X-ray interferometric Young fringes period is obtained. The subsequent reconstruction of the slit image as an object is performed by means of Fourier transform of the intensity distribution on the hologram. Three methods of reconstruction of the amplitude transmission complex function of the object are presented: analytical - approximate method, method of iteration and step by step method. As an example the X-ray Fourier interferometric hologram recording and the complex amplitude transmission function reconstruction for a beryllium circular wire are considered

New x-ray optical system for fluorescence beamline at Hasylab

International Nuclear Information System (INIS)

Falkenberg, G.; Tschentscher, T.

2000-01-01

Beamline L at HASYLAB/DESY is actually dedicated to micro x-ray fluorescence (μ-XRF) experiments using the white beam from a bending magnet of the storage ring DORIS III. To extend the applicability of beamline L to other x-ray fluorescence techniques, such as synchrotron radiation total reflection x-ray fluorescence (SR-TXRF) and micro x-ray absorption near edge structures in fluorescence mode (μ-XANES), new x-ray optics have been designed and are under installation at the moment. The suitability of beamline L for SR-TXRF experiments has been shown previously in a number of studies using temporary setups for beam monochromatization and collimation. The new optical system comprises a slit system, a pair of x-ray mirrors for focussing, collimation and high energy cut-off (12 keV and 30 keV), a double multilayer monochromator for broad bandpass applications (TXRF) and a double perfect-crystal monochromator for spectroscopy (XANES, speciation). The multilayer monochromator will utilize a pair of NiC with a spacing of 4.0 nm for the energy range 2-10 keV and a second pair of WB 4 C with a spacing of 3.0 nm for the range 4-30 keV. To extend the energy range for broad bandpass applications to higher photon energies SiGe gradient crystals are foreseen (ΔE/E ∼ 10 -3 ). For the perfect-crystal monochromator we have chosen a pair of Ge 111 crystals for the energy range 2-10 keV and Si 111 crystals for 7-90 keV. To enable the use of low photon energies down to 2 keV the monochromator vessel is sealed to the ring vacuum by a 25 μm thick carbon window. The mirrors and monochromators deflect the beam vertically and can be moved out of the beam independently. Fixed exit geometry permits the illumination of the same sample spot with different wavelength and energy bands. All optical elements accept the full vertical beam opening in order to enable both vertical and horizontal geometries for sample and detector. (author)

A new spectrometer for grazing incidence X-ray fluorescence for the characterization of Arsenic implants and Hf based high-k layers

International Nuclear Information System (INIS)

Ingerle, D.; Meirer, F.; Zoeger, N.; Pepponi, G.; Giubertoni, D.; Steinhauser, G.; Wobrauschek, P.; Streli, C.

2010-01-01

Grazing Incidence X-ray Fluorescence Analysis (GIXRF) is a powerful technique for depth-profiling and characterization of thin layers in depths up to a few hundred nanometers. By measurement of fluorescence signals at various incidence angles Grazing Incidence X-ray Fluorescence Analysis provides information on depth distribution and total dose of the elements in the layers. The technique is very sensitive even in depths of a few nanometers. As Grazing Incidence X-ray Fluorescence Analysis does not provide unambigous depth profile information and needs a realistic input depth profile for fitting, in the context of the EC funded European Integrated Activity of Excellence and Networking for Nano and Micro-Electronics Analysis (ANNA) Grazing Incidence X-ray Fluorescence Analysis is used as a complementary technique to Secondary Ion Mass Spectrometry (SIMS) for the characterization of Ultra Shallow Junctions (USJ). A measuring chamber was designed, constructed and tested to meet the requirements of Grazing Incidence X-ray Fluorescence Analysis. A measurement protocol was developed and tested. Some results for As implants as well as Hf based high k layers on Silicon are shown. For the determination of the bulk As content of the wafers, Instrumental Neutron Activation Analysis has also been applied for comparison.

Dynamical diffraction in periodic multilayers

CERN Document Server

Sears, V F

1997-01-01

Exact reflectivity curves are calculated numerically for various periodic multilayers using the optical matrix method in order to test the dynamical theory of diffraction. The theory is generally valid for values of the bilayer thickness d up to about 100 A. For somewhat larger values of d, where the theory begins to break down, the initial discrepancy is in the phase of the oscillations in the wings of the peaks. For very large values of d, where the first-order Bragg peak approaches the edge of the mirror reflection, two general types of multilayers can be distinguished. In the first (typified in the present work by Ni/Ti), there is a large (30% or more) reduction in the actual value of the critical wave vector for total reflection while, in the second (typified here by Fe/Ge), there is very little reduction (3 % or so). The origin of these two very different types of behavior is explained. It is also shown that, within the dynamical theory of diffraction, the change in the position of the center of the Dar...

Growth of ω inclusions in Ti alloys: An X-ray diffraction study

International Nuclear Information System (INIS)

Šmilauerová, J.; Harcuba, P.; Pospíšil, J.; Matěj, Z.; Holý, V.

2013-01-01

We investigated the size and crystal structure of nanometer-sized ω inclusions in single crystals of β-Ti alloys by X-ray diffraction pole-figure measurements and reciprocal space mapping. We studied the topotactical relation of the β and ω crystal lattices, and from the positions and shapes of the diffraction maxima of the ω lattice determined the mean size of the ω inclusions and the misfit of the inclusion lattice with respect to the host lattice, as well as their changes during ageing. The lattice of the ω inclusions exhibits a large positive misfit already before ageing and the misfit is subsequently reduced during the ageing process. Using the theories of elasticity and X-ray scattering we simulated diffuse X-ray scattering around the β diffraction maxima and demonstrated that the diffuse scattering is caused mainly by local elastic strains in the β host phase around the ω inclusions

Advanced Nanoscale Characterization of Cement Based Materials Using X-Ray Synchrotron Radiation: A Review

KAUST Repository

Chae, Sejung R.

2013-05-22

We report various synchrotron radiation laboratory based techniques used to characterize cement based materials in nanometer scale. High resolution X-ray transmission imaging combined with a rotational axis allows for rendering of samples in three dimensions revealing volumetric details. Scanning transmission X-ray microscope combines high spatial resolution imaging with high spectral resolution of the incident beam to reveal X-ray absorption near edge structure variations in the material nanostructure. Microdiffraction scans the surface of a sample to map its high order reflection or crystallographic variations with a micron-sized incident beam. High pressure X-ray diffraction measures compressibility of pure phase materials. Unique results of studies using the above tools are discussed-a study of pores, connectivity, and morphology of a 2,000 year old concrete using nanotomography; detection of localized and varying silicate chain depolymerization in Al-substituted tobermorite, and quantification of monosulfate distribution in tricalcium aluminate hydration using scanning transmission X-ray microscopy; detection and mapping of hydration products in high volume fly ash paste using microdiffraction; and determination of mechanical properties of various AFm phases using high pressure X-ray diffraction. © 2013 The Author(s).

Soft-x-ray magneto-optical Kerr effect and element-specific hysteresis measurement

Energy Technology Data Exchange (ETDEWEB)

Kortright, J.B.; Rice, M. [Lawrence Berkeley National Lab., CA (United States)

1997-04-01

Interest in the utilization of x-ray magneto-optical properties to provide element-specific magnetic information, combined with recent development of tunable linear polarizers for spectroscopic polarization measurement, have led the authors to the study of magneto-optical rotation (MOR) near core levels of magnetic atoms in magnetic multilayer and alloy films. Their initial observation of Faraday rotation (in transmission) demonstrated that for Fe MOR is easily measured and is larger at its L{sub 3} resonance than in the near-visible spectral regions. This work also demonstrated that the spectroscopic behavior of the MOR signal in transmission, resulting from the differential reaction of left- and right-circular components of a linearly polarized beam, is related to the magnetic circular dichroism (MCD), or differential absorption, as expected by a Kramers-Kronig transformation. Thus MCD measurements using circular polarization and MOR measurements using linear polarization can provide complementary, and in some cases equivalent, information. On beamline 6.3.2 the authors have begun to investigate soft x-ray MOR in the reflection geometry, the x-ray magneto-optic Kerr effect (XMOKE). Early measurements have demonstrated the ability to measure element-specific hysteresis loops and large rotations compared to analogous near-visible measurements. The authors are investigating the spectral dependence of the XMOKE signal, and have initiated systematic materials studies of sputter-deposited films of Fe, Fe{sub x}Cr{sub 1{minus}x} alloys, and Fe/Cr multilayers.

JEM-X observations of the Be/X-ray binary EXO 2030+375

DEFF Research Database (Denmark)

Nunez, S.M.; Reig, P.; Blay, P.

2003-01-01

We have used data from the Joint European Monitor (JEM-X) to perform an X-ray spectral and timing analysis of the 42-s transient pulsar EXO 2030+375 during an X-ray outburst. X-ray pulsations are clearly detected with an average pulse period of 41.66+/-0.05 s and an average pulse fraction of 60...

X-ray and optical observations of the ultrashort period dwarf nova SW Ursae Majoris - A likely new DQ Herculis star

Science.gov (United States)

Shafter, A. W.; Szkody, P.; Thorstensen, J. R.

1986-01-01

Time-resolved X-ray and optical photometric and optical spectroscopic observations of the ultrashort period cataclysmic variable SW UMa are reported. The spectroscopic observations reveal the presence of an s-wave component which is almost in phase with the extreme line wings and presumably the white dwarf. This very unusual phasing in conjunction with the available optical and X-ray data seems to indicate that a region of enhanced emission exists on the opposite side of the disk from the expected location of the hot spot. The photometric observations reveal the presence of a hump in the light curve occurring at an orbital phase which is consistent with the phase at which the region of enhanced line emission is most favorably seen. Changes in the hump amplitude are seen from night to night, and a 15.9 min periodicity is evident in the light curve. The optical and X-ray periodicities suggest that SW UMa is a member of the DQ Her class of cataclysmic variables.

Radiography simulation based on exposure buildup factors for multilayer structures

International Nuclear Information System (INIS)

Marinkovic, Predrag; Pesic, Milan

2009-01-01

Monte Carlo techniques were usually used to study the effect of scattered photons on a radiographic X-ray image. Such approach is accurate, but computer time consuming. On the other hand, the exposure buildup factors can be used as approximate and efficient assessment to account for the scattering of X-rays. This method uses the known radiography parameters to find the resulting detector exposure due to both scattered and un-collided photons. A model for radiography simulation, based on X-ray dose buildup factor, is proposed. This model includes non-uniform attenuation in voxelized object of imaging (patient body tissue). Composition of patient body is considered as a multi-layer structure. Various empirical formulas exist for multi-layer structure calculations and they all calculate multi-layer buildup factors by combining single-layer buildup factors. The proposed model is convenient in cases when more exact techniques (like Monte Carlo) are not economical. (author)

SWIFT-BAT HARD X-RAY SKY MONITORING UNVEILS THE ORBITAL PERIOD OF THE HMXB IGR J18219–1347

International Nuclear Information System (INIS)

La Parola, V.; Cusumano, G.; Segreto, A.; D'Aì, A.; Masetti, N.; D'Elia, V.

2013-01-01

IGR J18219–1347 is a hard X-ray source discovered by INTEGRAL in 2010. We have analyzed the X-ray emission of this source exploiting the Burst Alert Telescope (BAT) survey data up to 2012 March and the X-Ray Telescope (XRT) data that include also an observing campaign performed in early 2012. The source is detected at a significance level of ∼13 standard deviations in the 88 month BAT survey data, and shows a strong variability along the survey monitoring, going from high intensity to quiescent states. A timing analysis on the BAT data revealed an intensity modulation with a period of P 0 = 72.44 ± 0.3 days. The significance of this modulation is about seven standard deviations in Gaussian statistics. We interpret it as the orbital period of the binary system. The light curve folded at P 0 shows a sharp peak covering ∼30% of the period, superimposed to a flat level roughly consistent with zero. In the soft X-rays the source is detected only in 5 out of 12 XRT observations, with the highest recorded count rate corresponding to a phase close to the BAT folded light-curve peak. The long orbital period and the evidence that the source emits only during a small fraction of the orbit suggests that the IGR J18219–1347 binary system hosts a Be star. The broadband XRT+BAT spectrum is well modeled with a flat absorbed power law with a high-energy exponential cutoff at ∼11 keV

X-ray lenses with large aperture; Roentgenlinsen mit grosser Apertur

Energy Technology Data Exchange (ETDEWEB)

Simon, Markus

2010-07-01

Up to now, most X-ray imaging setups are based on absorption contrast imaging. There is a demand for focused X-rays in many X-ray analysis applications, either to increase the resolution of an imaging system, or, to reduce the time effort of an experiment through higher photon flux. For photon energies higher than 15 keV refractive X-ray optics are more efficient in comparison to non-refractive X-ray optics. The aim of this work was to develop X-ray lenses with large apertures and high transparency. By increasing the number of refracting surfaces while removing unnecessary lens material such lenses have been developed. Utilizing this approach the overall beam deflection angle is large with respect to the lens material it propagates through and so the transparency of the lens is increased. Within this work, X-ray lenses consisting of several thousands of prisms with an edge length in the range of micrometers have been developed and fabricated by deep X-ray lithography. Deep X-ray lithography enables high precision microstrucures with smooth sidewalls and large aspect ratios. The aperture of high-transparency X-ray lenses made this way is greater than 1 mm. They are suitable for photon energies in the range of 8 keV to 24 keV and offer a focal width of smaller than 10 {mu}m at a transparency of around 40%. Furthermore, rolled X-ray lenses have been developed, that are made out of a microstructured polyimide film, which is cut according to the requirements regarding focal length and photon energy. The microstructured film is fabricated by molding, using an anisotropically etched silicon wafer as molding tool. Its mean roughness is in the range of nanometers. The film features prismatic structures, its surface topology is similar to an asparagus field. The measured diameter of the point focus was 18 {mu}m to 31 {mu}m, the calculated opticla efficiency was 37%. Future work will concentrate on increasing the aspect ratio of Prism Lenses and on increasing the rolling

The 5 Hour Pulse Period and Broadband Spectrum of the Symbiotic X-Ray Binary 3A 1954+319

Science.gov (United States)

Marcu, Diana M.; Fuerst, Felix; Pottschmidt, Katja; Grinberg, Victoria; Miller, Sebstian; Wilms, Joern; Postnov, Konstantin A.; Corbet, Robin H. D.; Markwardt, Craig B.; Cadolle Bel, Marion

2011-01-01

We present an analysis of the highly variable accreting X-ray pulsar 3A 1954+319 using 2005-2009 monitoring data obtained with INTEGRAL and Swift. This considerably extends the pulse period history and covers flaring episodes in 2005 and 2008. In 2006 the source was identified as one of only a few known symbiotic X-ray binaries, Le" systems composed of a neutron star accreting from the inhomogeneous medium around an M-giant star. The extremely long pulse period of approximately 5.3 h is directly visible in the 2008 INTEGRAL-ISGRI outburst light curve. The pulse profile is double peaked and not significantly energy dependent. During the outburst a strong spin-up of -1.8 x 10(exp -4) h h(exp -1) occurred. Between 2005 and 2008 a long term spin-down trend of 2.1 x 10(exp -5) h h(exp -1) was observed for the first time for this source. The 3-80 keV pulse peak spectrum of 3A 1954+319 during the 2008 flare could be well described by a thermal Comptonization model. We interpret the results within the framework of a recently developed quasi-spherical accretion model for symbiotic X-ray binaries.

Spectral and temporal properties of the X-ray pulsar SMC X-1 at hard X-rays

Science.gov (United States)

Kunz, M.; Gruber, D. E.; Kendziorra, E .; Kretschmar, P.; Maisack, M.; Mony, B.; Staubert, R.; Doebereiner, S.; Englhauser, J.; Pietsch, W.

1993-01-01

The binary X-ray pulsar SMC X- 1 has been observed at hard X-rays with the High Energy X-Ray Experiment (HEXE) on nine occasions between Nov. 1987 and March 1989. A thin thermal bremsstrahlung fit to the phase averaged spectrum yields a plasma temperature (14.4 +/- 1.3) keV and a luminosity above (1.1 +/- 0.1) x 10 exp 38 erg/s in the 20-80 keV band. Pulse period values have been established for three observations, confirming the remarkably stable spin-up trend of SMC X-1. In one of the three observations the pulse profile was seen to deviate from a dominant double pulsation, while at the same time the pulsed fraction was unusually large. For one observation we determined for the first time the pulsed fraction in narrow energy bands. It increases with photon energy from about 20 percent up to over 60 percent in the energy range from 20 to 80 keV.

The Radiative X-ray and Gamma-ray Efficiencies of Rotation-powered Pulsars

Science.gov (United States)

Vink, Jacco; Bamba, Aya; Yamazaki, Ryo

2011-02-01

We present a statistical analysis of the X-ray luminosity of rotation-powered pulsars and their surrounding nebulae using the sample of Kargaltsev & Pavlov, and we complement this with an analysis of the γ-ray emission of Fermi-detected pulsars. We report a strong trend in the efficiency with which spin-down power is converted to X-ray and γ-ray emission with characteristic age: young pulsars and their surrounding nebulae are efficient X-ray emitters, whereas in contrast old pulsars are efficient γ-ray emitters. We divided the X-ray sample in a young (τ c < 1.7 × 104 yr) and old sample and used linear regression to search for correlations between the logarithm of the X-ray and γ-ray luminosities and the logarithms of the periods and period derivatives. The X-ray emission from young pulsars and their nebulae are both consistent with L_X ∝ \\dot{P}^3/P^6. For old pulsars and their nebulae the X-ray luminosity is consistent with a more or less constant efficiency η ≡ L_X/\\dot{E}_{rot} ≈ 8× 10^{-5}. For the γ-ray luminosity we confirm that L_γ ∝ √{\\dot{E}_{rot}}. We discuss these findings in the context of pair production inside pulsar magnetospheres and the striped wind model. We suggest that the striped wind model may explain the similarity between the X-ray properties of the pulsar wind nebulae and the pulsars themselves, which according to the striped wind model may both find their origin outside the light cylinder, in the pulsar wind zone.

Advances in thin film diffraction instrumentation by X-ray optics

International Nuclear Information System (INIS)

Haase, A.

1996-01-01

The structural characterisation of thin films requires a parallel X-ray beam of high intensity. Parallel beam geometry is commonly used in high resolution and single crystal experiments, but also in the field of X-ray diffraction for polycrystalline material (e.g. in phase, texture and stress analysis). For grazing incidence diffraction (GID), the use of small slits on the primary side and of long soller slits with a flat monochromator on the secondary side is standard. New optical elements have been introduced with polychromatic or monochromatic radiation. By means of different applications the results are compared with those of classical beam optics. X-ray fiber optics utilize total external reflection of X-rays on smooth surfaces. Effects of monochromatization are presented. In many fields of application, fiber optics may replace conventional collimators. The use of primary and secondary channel cut crystals can also produce a high parallel monochromatic X-ray beam. A parabolically bent graded multilayer produces a monochromatic parallel beam of high intensity. Compared with classical Bragg-Brentano (focussing) geometry, excellent results have been obtained, especially for samples with an irregular shape. In combination with a channel cut monochromator there is a substantial gain in intensity leading to an increase of the dynamic intensity range of rocking curves

Advances in thin film diffraction instrumentation by X-ray optics

Energy Technology Data Exchange (ETDEWEB)

Haase, A [Rich. Seifert and Co., Analytical X-ray Systems, Ahrensburg (Germany)

1996-09-01

The structural characterisation of thin films requires a parallel X-ray beam of high intensity. Parallel beam geometry is commonly used in high resolution and single crystal experiments, but also in the field of X-ray diffraction for polycrystalline material (e.g. in phase, texture and stress analysis). For grazing incidence diffraction (GID), the use of small slits on the primary side and of long soller slits with a flat monochromator on the secondary side is standard. New optical elements have been introduced with polychromatic or monochromatic radiation. By means of different applications the results are compared with those of classical beam optics. X-ray fiber optics utilize total external reflection of X-rays on smooth surfaces. Effects of monochromatization are presented. In many fields of application, fiber optics may replace conventional collimators. The use of primary and secondary channel cut crystals can also produce a high parallel monochromatic X-ray beam. A parabolically bent graded multilayer produces a monochromatic parallel beam of high intensity. Compared with classical Bragg-Brentano (focussing) geometry, excellent results have been obtained, especially for samples with an irregular shape. In combination with a channel cut monochromator there is a substantial gain in intensity leading to an increase of the dynamic intensity range of rocking curves.

The orbital period in the supergiant fast X-ray transient IGR J16465--4507

OpenAIRE

Clark, D. J.; Sguera, V.; Bird, A. J; McBride, V. A.; Hill, A. B.; Scaringi, S.; Drave, S.; Bazzano, A.; Dean, A. J

2010-01-01

Timing analysis of the INTEGRAL-IBIS and Swift-BAT light curves of the Supergiant Fast X-ray Transient (SFXT) IGR J16465-4507 has identified a period of 30.32+/-0.02 days which we interpret as the orbital period of the binary system. In addition 11 outbursts (9 of which are previously unpublished) have been found between MJD 52652 to MJD 54764, all of which occur close to the region of the orbit we regard as periastron. From the reported flux outbursts, we found a dynamical range in the inter...

X-Ray Topography of the Subsurface Crystal Layers in the Skew Asymmetric Reflection Geometry

Directory of Open Access Journals (Sweden)

Swiątek Z.

2016-12-01

Full Text Available The technique of X ray topography with the asymmetric reflection geometry of X-ray diffraction presented in this paper as useful tool for structural characterization of materials, particularly, epitaxial thin films and semiconductor multi-layered crystal systems used for the optoelectronic devices. New possibilities of this technique for a layer-by-layer visualization of structural changes in the subsurface crystal layers are demonstrated for semiconductors after various types of surface treatment, such as chemical etching, laser irradiation and ion implantation.

X-ray filter for x-ray powder diffraction

Science.gov (United States)

Sinsheimer, John Jay; Conley, Raymond P.; Bouet, Nathalie C. D.; Dooryhee, Eric; Ghose, Sanjit

2018-01-23

Technologies are described for apparatus, methods and systems effective for filtering. The filters may comprise a first plate. The first plate may include an x-ray absorbing material and walls defining first slits. The first slits may include arc shaped openings through the first plate. The walls of the first plate may be configured to absorb at least some of first x-rays when the first x-rays are incident on the x-ray absorbing material, and to output second x-rays. The filters may comprise a second plate spaced from the first plate. The second plate may include the x-ray absorbing material and walls defining second slits. The second slits may include arc shaped openings through the second plate. The walls of the second plate may be configured to absorb at least some of second x-rays and to output third x-rays.

High energy X-ray observations of CYG X-3 from from OSO-8: Further evidence of a 34.1 day period

Science.gov (United States)

Dolan, J. F.; Crannell, C. J.; Dennis, B. R.; Frost, K. J.; Orwig, L. E.

1981-01-01

The X-ray source Cyg X-3 (=4U2030+40) was observed with the high energy X-ray spectrometer on OSO-8 for two weeks in 1975 and in 1976 and for one week in 1977. No change in spectral shape and intensity above 23 keV was observed from year to year. No correlation is observed between the source's intensity and the phase of the 34.1 day period discovered by Molteni, et al. (1980). The pulsed fraction of the 4.8 hour light curve between 23 and 73 keV varies from week to week, however, and the magnitude of the pulsed fraction appears to be correlated with the 34.1 day phase. No immediate explanation of this behavior is apparent in terms of previously proposed models of the source.

Interface stress in Au/Ni multilayers

DEFF Research Database (Denmark)

Schweitz, K.O.; Böttiger, J.; Chevallier, J.

2000-01-01

The effect of intermixing on the apparent interface stress is studied in -textured dc-magnetron sputtered Au/Ni multilayers by use of two methods commonly used for determining interface stress. The method using profilometry and in-plane x-ray diffraction does not take intermixing...... into account and yields an apparent interface stress of -8.46 +/- 0.99 J m(-2). However, observed discrepancies between model calculations and measured high-angle x-ray diffractograms indicate intermixing, and by use of the profilometry and sin(2) psi method the real interface stress value of -2.69 +/- 0.43 J...... m(-2) is found. This method also reveals a significant and systematic change of the stress-free lattice parameter of both constituents as a function of modulation period which is shown to account for the difference between the two findings. The method using in-plane diffraction is thus shown...

An extended X-ray low state from Hercules X-1

International Nuclear Information System (INIS)

Parmar, A.N.; White, N.E.; Barr, P.; Pietsch, W.; Truemper, J.; Voges, W.; McKechnie, S.

1985-01-01

Hercules X-1 exhibits a 35-day cycle in its X-ray intensity in addition to its pulsar rotational and orbital periodicities of 1.24s and 1.7 days respectively. The authors report here observations made with the EXOSAT Observatory between 1983 June and August that failed to detect the expected 35-day variation in X-ray intensity, although low-level extended X-ray emission was seen. The EXOSAT observations suggest that a temporary change in the disk structure may have occurred such that the disk was in the line of sight throughout. (author)

Direct observation and analysis of york-shell materials using low-voltage high-resolution scanning electron microscopy: Nanometal-particles encapsulated in metal-oxide, carbon, and polymer

Directory of Open Access Journals (Sweden)

Shunsuke Asahina

2014-11-01

Full Text Available Nanometal particles show characteristic features in chemical and physical properties depending on their sizes and shapes. For keeping and further enhancing their features, the particles should be protected from coalescence or degradation. One approach is to encapsulate the nanometal particles inside pores with chemically inert or functional materials, such as carbon, polymer, and metal oxides, which contain mesopores to allow permeation of only chemicals not the nanometal particles. Recently developed low-voltage high-resolution scanning electron microscopy was applied to the study of structural, chemical, and electron state of both nanometal particles and encapsulating materials in york-shell materials of Au@C, Ru/Pt@C, Au@TiO2, and Pt@Polymer. Progresses in the following categories were shown for the york-shell materials: (i resolution of topographic image contrast by secondary electrons, of atomic-number contrast by back-scattered electrons, and of elemental mapping by X-ray energy dispersive spectroscopy; (ii sample preparation for observing internal structures; and (iii X-ray spectroscopy such as soft X-ray emission spectroscopy. Transmission electron microscopy was also used for characterization of Au@C.

X-ray fluorescence imaging with polycapillary X-ray optics

International Nuclear Information System (INIS)

Yonehara, Tasuku; Yamaguchi, Makoto; Tsuji, Kouichi

2010-01-01

X-ray fluorescence spectrometry imaging is a powerful tool to provide information about the chemical composition and elemental distribution of a specimen. X-ray fluorescence spectrometry images were conventionally obtained by using a μ-X-ray fluorescence spectrometry spectrometer, which requires scanning a sample. Faster X-ray fluorescence spectrometry imaging would be achieved by eliminating the process of sample scanning. Thus, we developed an X-ray fluorescence spectrometry imaging instrument without sample scanning by using polycapillary X-ray optics, which had energy filter characteristics caused by the energy dependence of the total reflection phenomenon. In the present paper, we show that two independent straight polycapillary X-ray optics could be used as an energy filter of X-rays for X-ray fluorescence. Only low energy X-rays were detected when the angle between the two optical axes was increased slightly. Energy-selective X-ray fluorescence spectrometry images with projection mode were taken by using an X-ray CCD camera equipped with two polycapillary optics. It was shown that Fe Kα (6.40 keV) and Cu Kα (8.04 keV) could be discriminated for Fe and Cu foils.

X-ray Characterization of Materials

Science.gov (United States)

Lifshin, Eric

1999-09-01

Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composition and crystal and grain structures of all types of materials. The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material unique. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods.

Calibration of hard x-ray (15 - 50 keV) optics at the MPE test facility PANTER

Science.gov (United States)

Bräuninger, Heinrich; Burkert, Wolfgang; Hartner, Gisela D.; Citterio, Oberto; Ghigo, Mauro; Mazzoleni, Francesco; Pareschi, Giovanni; Spiga, Daniele

2004-02-01

The Max-Planck-Institut für extraterrestrische Physik (MPE) in Garching, Germany, operates the large X-ray beam line facility PANTER for testing astronomical systems. At PANTER a number of telescopes like EXOSAT, ROSAT, SAX, JET-X, ABRIXAS, XMM and SWIFT operating in the soft energy range (0.02 - 15 keV) have been successfully calibrated. In the present paper we report on an important upgrade recently implemented that enables the calibration of hard X-ray optics (from 15 up to 50 keV). Currently hard X-ray optics based on single and multilayer coating are being developed for several future X-ray missions. The hard X-ray calibrations at PANTER are carried out by a high energy source based on an electron gun and several anodes, able to cover the energy range from 4.5 up to 50 keV. It provides fluxes up to 104 counts/sec/cm2 at the instrument chamber with a stability better than 1%. As detector a pn-CCD camera operating between 0.2 and 50 keV and a collecting area of 36 cm2 is used. Taking into account the high energy resolution of the CCD (145 eV at 6 keV), a very easy way to operate the facility in hard X-ray is in energy-dispersive mode (i.e. with a broad-band beam). A double crystal monochromator is also available providing energies up to 20 keV. In this paper we present the first results obtained by using PANTER for hard X-ray characterizations, performed on prototype multilayer optics developed by the Osservatorio Astronomico di Brera (OAB), Milano, Italy, and the Harvard-Smithsonian Center for Astrophysics (CfA), Cambridge, MA, USA.

Very high resolution UV and x-ray spectroscopy and imagery of solar active regions. Final report

International Nuclear Information System (INIS)

Bruner, M.; Brown, W.A.; Haisch, B.M.

1987-01-01

A scientific investigation of the physics of the solar atmosphere, which uses the techniques of high resolution soft x-ray spectroscopy and high resolution UV imagery, is described. The experiments were conducted during a series of three sounding rocket flights. All three flights yielded excellent images in the UV range, showing unprecedented spatial resolution. The second flight recorded the x-ray spectrum of a solar flare, and the third that of an active region. A normal incidence multi-layer mirror was used during the third flight to make the first astronomical x-ray observations using this new technique

X-ray time and spectral variability as probes of ultraluminous x-ray sources

Science.gov (United States)

Pasham, Dheeraj Ranga Reddy

A long-standing debate in the field of ultraluminous X-ray sources (ULXs: luminosities > 3x1039 ergs s-1) is whether these objects are powered by stellar-mass black holes (mass range of 3-25 solar masses) undergoing hyper-accretion/emission or if they host the long-sought after class of intermediate-mass black holes (mass range of a few 100-1000 solar masses) accreting material at sub-Eddington rates. We present X-ray time and energy spectral variability studies of ULXs in order to understand their physical environments and accurately weigh their compact objects. A sample of ULXs exhibit quasi-periodic oscillations (QPOs) with centroid frequencies in the range of 10-200 mHz. The nature of the power density spectra (PDS) of these sources is qualitatively similar to stellar-mass black holes when they exhibit the so-called type-C low-frequency QPOs (frequency range of 0.2-15 Hz). However, the crucial difference is that the characteristic frequencies within the PDS of ULXs, viz., the break frequencies and the centroid frequencies of the QPOs, are scaled down by a factor of approximately 10-100 compared to stellar-mass black holes. It has thus been argued that the ULX mHz QPOs are the type-C low-frequency QPO analogs of stellar-mass black holes and that the observed difference in the frequencies (a fewx0.01 Hz compared with a few Hz) is due to the presence of intermediate-mass black holes ( MULX = (QPOstellar-mass black hole }/QPOULX)xM stellar-mass black hole, where M and QPO are the mass and the QPO frequency, respectively) within these ULXs. We analyzed all the archival XMM-Newton X-ray data of ULXs NGC 5408 X-1 and M82 X-1 in order to test the hypothesis that the ULX mHz QPOs are the type-C analogs by searching for a correlation between the mHz QPO frequency and the energy spectral power-law index as type-C QPOs show such a dependence. From our multi-epoch timing and spectral analysis of ULXs NGC 5408 X-1 and M82 X-1, we found that the mHz QPOs of these sources vary

Interface characterization in B-based multilayer mirrors for next generation lithography

International Nuclear Information System (INIS)

Naujok, Philipp; Yulin, Sergiy; Müller, Robert; Kaiser, Norbert; Tünnermann, Andreas

2016-01-01

The interfaces in La/B_4C and LaN/B_4C multilayer mirrors designed for near normal incidence reflection of 6.x nm EUV light were investigated by grazing incidence X-ray reflectometry, high-resolution transmission electron microscopy and EUV reflectometry. The thickness and roughness asymmetries of the different interfaces in both studied systems have been identified. A development of interface roughness with an increasing number of bilayers was found by different investigation methods. For near normal incidence, R = 51.1% @ λ = 6.65 nm could be reached with our La/B_4C multilayer mirrors, whereas R = 58.1% was achieved with LaN/B_4C multilayers at the same wavelength. - Highlights: • Interface structure in B-based multilayer mirrors investigated. • Combining X-ray reflection, EUV reflection and transmission electron microscopy • Interface thickness and roughness asymmetry identified • Interface roughness increases with higher number of bilayers.

Low Dose X-Ray Speckle Visibility Spectroscopy Reveals Nanoscale Dynamics in Radiation Sensitive Ionic Liquids

Science.gov (United States)

Verwohlt, Jan; Reiser, Mario; Randolph, Lisa; Matic, Aleksandar; Medina, Luis Aguilera; Madsen, Anders; Sprung, Michael; Zozulya, Alexey; Gutt, Christian

2018-04-01

X-ray radiation damage provides a serious bottleneck for investigating microsecond to second dynamics on nanometer length scales employing x-ray photon correlation spectroscopy. This limitation hinders the investigation of real time dynamics in most soft matter and biological materials which can tolerate only x-ray doses of kGy and below. Here, we show that this bottleneck can be overcome by low dose x-ray speckle visibility spectroscopy. Employing x-ray doses of 22-438 kGy and analyzing the sparse speckle pattern of count rates as low as 6.7 ×10-3 per pixel, we follow the slow nanoscale dynamics of an ionic liquid (IL) at the glass transition. At the prepeak of nanoscale order in the IL, we observe complex dynamics upon approaching the glass transition temperature TG with a freezing in of the alpha relaxation and a multitude of millisecond local relaxations existing well below TG . We identify this fast relaxation as being responsible for the increasing development of nanoscale order observed in ILs at temperatures below TG .

The Ultracompact Nature of the Black Hole Candidate X-Ray Binary 47 Tuc X9

Science.gov (United States)

Bahramian, Arash; Heinke, Craig O.; Tudor, Vlad; Miller-Jones, James C. A.; Bogdanov, Slavko; Maccarone, Thomas J.; Knigge, Christian; Sivakoff, Gregory R.; Chomiuk, Laura; Strader, J.;

Wavelength Dispersive X-ray Fluorescence Spectrometry for the Analysis of Organic Polymer Film

International Nuclear Information System (INIS)

Choi, Yong Suk; Park, Yong Joon; Kim, Jong Yun

2008-01-01

Recently, many studies have been focused on the thin films because there are numerous industrial processes relevant to thin films such as fuel cells, sensors, lubricants, coatings, and so on. Physical and chemical properties of solid surface have been modified by ultra-thin coatings such as Langmuir-Blodgett (LB) method with a variety of types of organic functional materials for the specific purposes in many applications. In addition, the layer-by-layer technique using polyelectrolyte films are now of interest as biosensors, electrochromic and electroluminescent devices, etc. In general, several methods such as X-ray or neutron reflectivity, and quartz crystal microbalance (QCM) have been utilized for the thin film analysis. These optical techniques can measure the film thicknesses up to hundreds of nanometers while X-ray photoelectron spectroscopy is widely used to study a few nanometers thick films. Other methods such as X-ray Photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), transmission electron microscopy (TEM), and atom force microscopy (AFM) have also been used in the film analysis in spite of some disadvantages for each method. X-ray fluorescence (XRF) has long been used as a rapid and simple analytical tool for the analysis of elemental composition of materials. XRF technique is suitable for on-line or in-line real-time monitoring because it is a non-destructive and rapid analysis with good precision and good accuracy at low cost. The aim of this work is to develop a new analytical technique for the quantitative analysis of polymer film on metal substrate. In the present study, Compton peak profile was investigated under different experimental conditions by using wavelength-dispersive XRF (WD-XRF). Compared to energy-dispersive XRF (ED-XRF), WD-XRF is more adequate in an accurate quantitative analysis of thin organic film

A mechanical and tribological study of Cr/CrN multilayer coatings

Energy Technology Data Exchange (ETDEWEB)

Arias, D.F., E-mail: diegomas@gmail.com [Grupo GEMA, Universidad Católica de Pereira, Pereira (Colombia); Gómez, A. [Laboratório de Fenômenos de Superficie, Escola Politécnica, Universidade de Sao Paulo, Sao Paulo (Brazil); Pontificia Universidad Javeriana Cali (Colombia); Vélez, J.M. [Escuela de Ingeniería de Materiales, Universidad Nacional de Colombia Sede Medellín (Colombia); Souza, R.M. [Laboratório de Fenômenos de Superficie, Escola Politécnica, Universidade de Sao Paulo, Sao Paulo (Brazil); Olaya, J.J. [Departamento de Ingeniería Mecánica y Mecatrónica, Universidad Nacional de Colombia, Bogotá (Colombia)

2015-06-15

Multilayer Cr/CrN coatings with different periodicities were grown on silicon substrates by means of a magnetron sputtering technique. Thin films with only Cr or CrN were also grown, in order to use them as reference samples. Structural, morphological, mechanical and tribological characterization were carried out by using X-ray diffraction (XRD), atomic force microscopy (AFM), nanohardness and nanoscratch techniques, respectively. The characterization results were analyzed as a function of the bilayer thickness (period). In general, the multilayer hardness value increased with the decrease in period. In addition, the validity of the Hall-Petch relationship was confirmed for grain sizes and period values greater than 146 nm and 333 nm, respectively. The coefficient of friction (COF) increased with increasing load, which indicates the contribution of the adhesion to the COF. - Highlights: • Multilayer Cr/CrN coatings with layer thickness between 200 and 1000 nm were grown. • Neither bias voltage not temperature were applied during deposition. • The hardness improves with the increase of the number of bilayers. • The wear rate decreases with the increase of the number of bilayers.

Genetic algorithm using independent component analysis in x-ray reflectivity curve fitting of periodic layer structures

International Nuclear Information System (INIS)

Tiilikainen, J; Bosund, V; Tilli, J-M; Sormunen, J; Mattila, M; Hakkarainen, T; Lipsanen, H

2007-01-01

A novel genetic algorithm (GA) utilizing independent component analysis (ICA) was developed for x-ray reflectivity (XRR) curve fitting. EFICA was used to reduce mutual information, or interparameter dependences, during the combinatorial phase. The performance of the new algorithm was studied by fitting trial XRR curves to target curves which were computed using realistic multilayer models. The median convergence properties of conventional GA, GA using principal component analysis and the novel GA were compared. GA using ICA was found to outperform the other methods with problems having 41 parameters or more to be fitted without additional XRR curve calculations. The computational complexity of the conventional methods was linear but the novel method had a quadratic computational complexity due to the applied ICA method which sets a practical limit for the dimensionality of the problem to be solved. However, the novel algorithm had the best capability to extend the fitting analysis based on Parratt's formalism to multiperiodic layer structures

Discovery of Periodic Dips in the Brightest Hard X-Ray Source of M31 with EXTraS

Science.gov (United States)

Marelli, Martino; Tiengo, Andrea; De Luca, Andrea; Salvetti, David; Saronni, Luca; Sidoli, Lara; Paizis, Adamantia; Salvaterra, Ruben; Belfiore, Andrea; Israel, Gianluca; Haberl, Frank; D’Agostino, Daniele

2017-12-01

We performed a search for eclipsing and dipping sources in the archive of the EXTraS project—a systematic characterization of the temporal behavior of XMM-Newton point sources. We discovered dips in the X-ray light curve of 3XMM J004232.1+411314, which has been recently associated with the hard X-ray source dominating the emission of M31. A systematic analysis of XMM-Newton observations revealed 13 dips in 40 observations (total exposure time of ∼0.8 Ms). Among them, four observations show two dips, separated by ∼4.01 hr. Dip depths and durations are variable. The dips occur only during low-luminosity states ({L}0.2{--12}< 1× {10}38 erg s‑1), while the source reaches {L}0.2{--12}∼ 2.8× {10}38 erg s‑1. We propose that this system is a new dipping low-mass X-ray binary in M31 seen at high inclination (60°–80°) the observed dipping periodicity is the orbital period of the system. A blue HST source within the Chandra error circle is the most likely optical counterpart of the accretion disk. The high luminosity of the system makes it the most luminous (not ULX) dipper known to date.

X-Ray Absorption with Transmission X-Ray Microscopes

NARCIS (Netherlands)

de Groot, F.M.F.

2016-01-01

In this section we focus on the use of transmission X-ray microscopy (TXM) to measure the XAS spectra. In the last decade a range of soft X-ray and hard X-ray TXM microscopes have been developed, allowing the measurement of XAS spectra with 10–100 nm resolution. In the hard X-ray range the TXM

Quantitative strain analysis of surfaces and interfaces using extremely asymmetric x-ray diffraction

International Nuclear Information System (INIS)

Akimoto, Koichi; Emoto, Takashi

2010-01-01

Strain can reduce carrier mobility and the reliability of electronic devices and affect the growth mode of thin films and the stability of nanometer-scale crystals. To control lattice strain, a technique for measuring the minute lattice strain at surfaces and interfaces is needed. Recently, an extremely asymmetric x-ray diffraction method has been developed for this purpose. By employing Darwin's dynamical x-ray diffraction theory, quantitative evaluation of strain at surfaces and interfaces becomes possible. In this paper, we review our quantitative strain analysis studies on native SiO 2 /Si interfaces, reconstructed Si surfaces, Ni/Si(111)-H interfaces, sputtered III-V compound semiconductor surfaces, high-k/Si interfaces, and Au ion-implanted Si. (topical review)

Disk Disruptions and X-ray Intensity Excursions in Cyg X-2, LMC X-3 and Cyg X-3

Science.gov (United States)

Boyd, P. T.; Smale, A. P.

2001-05-01

The RXTE All Sky Monitor soft X-ray light curves of many X-ray binaries show long-term intensity variations (a.k.a "superorbital periodicities") that have been ascribed to precession of a warped, tilted accretion disk around the X-ray source. We have found that the excursion times between X-ray minima in Cyg X-2 can be characterized as a series of integer multiples of the 9.8 binary orbital period, (as opposed to the previously reported stable 77.7 day single periodicity, or a single modulation whose period changes slowly with time). While the data set is too short for a proper statistical analysis, it is clear that the length of any given intensity excursion cannot be used to predict the next (integer) excursion length in the series. In the black hole candidate system LMC X-3, the excursion times are shown to be related to each other by rational fractions. We find that the long term light curve of the unusual galactic X-ray jet source Cyg X-3 can also be described as a series of intensity excursions related to each other by integer multiples of a fundamental underlying clock. In the latter cases, the clock is apparently not related to the known binary periods. A unified physical model, involving both an inclined accretion disk and a fixed-probability disk disruption mechanism is presented, and compared with three-body scattering results. Each time the disk passes through the orbital plane it experiences a fixed probability P that it will disrupt. This model has testable predictions---the distribution of integers should resemble that of an atomic process with a characteristic half life. Further analysis can support or refute the model, and shed light on what system parameters effectively set the value of P.

Studies of oxide-based thin-layered heterostructures by X-ray scattering methods

Energy Technology Data Exchange (ETDEWEB)

Durand, O. [Thales Research and Technology France, Route Departementale 128, F-91767 Palaiseau Cedex (France)]. E-mail: olivier.durand@thalesgroup.com; Rogers, D. [Nanovation SARL, 103 bis rue de Versailles 91400 Orsay (France); Universite de Technologie de Troyes, 10-12 rue Marie Curie, 10010 (France); Teherani, F. Hosseini [Nanovation SARL, 103 bis rue de Versailles 91400 Orsay (France); Andrieux, M. [LEMHE, ICMMOCNRS-UMR 8182, Universite d' Orsay, Batiment 410, 91410 Orsay (France); Modreanu, M. [Tyndall National Institute, Lee Maltings, Prospect Row, Cork (Ireland)

2007-06-04

Some X-ray scattering methods (X-ray reflectometry and Diffractometry) dedicated to the study of thin-layered heterostructures are presented with a particular focus, for practical purposes, on the description of fast, accurate and robust techniques. The use of X-ray scattering metrology as a routinely working non-destructive testing method, particularly by using procedures simplifying the data-evaluation, is emphasized. The model-independent Fourier-inversion method applied to a reflectivity curve allows a fast determination of the individual layer thicknesses. We demonstrate the capability of this method by reporting X-ray reflectometry study on multilayered oxide structures, even when the number of the layers constitutive of the stack is not known a-priori. Fast Fourier transform-based procedure has also been employed successfully on high resolution X-ray diffraction profiles. A study of the reliability of the integral-breadth methods in diffraction line-broadening analysis applied to thin layers, in order to determine coherent domain sizes, is also reported. Examples from studies of oxides-based thin-layers heterostructures will illustrate these methods. In particular, X-ray scattering studies performed on high-k HfO{sub 2} and SrZrO{sub 3} thin-layers, a (GaAs/AlOx) waveguide, and a ZnO thin-layer are reported.

Experimental coherent X-ray diffractive imaging: capabilities and limitations of the technique

International Nuclear Information System (INIS)

Schropp, Andreas

2008-08-01

The investigations pursued during this work were focused on the testing of the applicability of the coherent X-ray diffractive imaging(CXDI)-method in the hard X-ray regime and different measurements were carried out at photon energies between 7 keV and 10 keV. The samples investigated were lithographically prepared two-dimensional gold structures with a size ranging from 3 μm to 10 μm as well as a cluster of gold spheres with a lateral extension of about 3.5 μm. Continuous diffraction patterns were recorded in small angle scattering geometry. In some of the measurements a scattering signal up to the edge of the detector could be measured which corresponds to a lateral resolution of about 30 nm. For certain samples it was possible to reconstruct the object from the measured diffraction data. Since the scattered intensity of non-periodic objects is weak at large scattering angles, the available photon flux is finally the main limitation of the method with regard to the achievable resolution. The experimental data were used to get an estimate of photon flux required for sub-nanometer resolution. The ptychographic iterative phase retrieval algorithm proposed by J. M. Rodenburg et al. (2004) was implemented and tested on simulated diffraction data. Additionally, a genetic algorithm has been developed and implemented for phase retrieval. This algorithm is very different from state-of-the-art algorithms and allows to introduce further experimentally important parameters such as a certain illumination function and partial coherence of the X-ray light. (orig.)

Bright x-ray flares in gamma-ray burst afterglows.

Science.gov (United States)

Burrows, D N; Romano, P; Falcone, A; Kobayashi, S; Zhang, B; Moretti, A; O'brien, P T; Goad, M R; Campana, S; Page, K L; Angelini, L; Barthelmy, S; Beardmore, A P; Capalbi, M; Chincarini, G; Cummings, J; Cusumano, G; Fox, D; Giommi, P; Hill, J E; Kennea, J A; Krimm, H; Mangano, V; Marshall, F; Mészáros, P; Morris, D C; Nousek, J A; Osborne, J P; Pagani, C; Perri, M; Tagliaferri, G; Wells, A A; Woosley, S; Gehrels, N

2005-09-16

Gamma-ray burst (GRB) afterglows have provided important clues to the nature of these massive explosive events, providing direct information on the nearby environment and indirect information on the central engine that powers the burst. We report the discovery of two bright x-ray flares in GRB afterglows, including a giant flare comparable in total energy to the burst itself, each peaking minutes after the burst. These strong, rapid x-ray flares imply that the central engines of the bursts have long periods of activity, with strong internal shocks continuing for hundreds of seconds after the gamma-ray emission has ended.

Langmuir-Blodgett and X-ray diffraction studies of isolated photosystem II reaction centers in monolayers and multilayers: physical dimensions of the complex.

Science.gov (United States)

Uphaus, R A; Fang, J Y; Picorel, R; Chumanov, G; Wang, J Y; Cotton, T M; Seibert, M

1997-04-01

The photosystem II (PSII) reaction center (RC) is a hydrophobic intrinsic protein complex that drives the water-oxidation process of photosynthesis. Unlike the bacterial RC complex, an X-ray crystal structure of the PSII RC is not available. In order to determine the physical dimensions of the isolated PSII RC complex, we applied Langmuir techniques to determine the cross-sectional area of an isolated RC in a condensed monolayer film. Low-angle X-ray diffraction results obtained by examining Langmuir-Blodgett multilayer films of alternating PSII RC/Cd stearate monolayers were used to determine the length (or height; z-direction, perpendicular to the plane of the original membrane) of the complex. The values obtained for a PSII RC monomer were 26 nm2 and 4.8 nm, respectively, and the structural integrity of the RC in the multilayer film was confirmed by several approaches. Assuming a cylindrical-type RC structure, the above dimensions lead to a predicted volume of about 125 nm3. This value is very close to the expected volume of 118 nm3, calculated from the known molecular weight and partial specific volume of the PSII RC proteins. This same type of comparison was also made with the Rhodobacter sphaeroides RC based on published data, and we conclude that the PSII RC is much shorter in length and has a more regular solid geometric structure than the bacterial RC. Furthermore, the above dimensions of the PSII RC and those of PSII core (RC plus proximal antenna) proteins protruding outside the plane of the PSII membrane into the lumenal space as imaged by scanning tunneling microscopy (Seibert, Aust. J. Pl. Physiol. 22, 161-166, 1995) fit easily into the known dimensions of the PSII core complex visualized by others as electron-density projection maps. From this we conclude that the in situ PSII core complex is a dimeric structure containing two copies of the PSII RC.

X-ray dichroism of rare earth materials

International Nuclear Information System (INIS)

Goedkoop, J.B.

1989-01-01

The theme of this thesis is the investigation of the strong polarization dependende, or dichroism, that occur in the X-ray absorption spectra of rare earth materials. The rare earth elements distinguish themselves from the other elements through the behaviour of the 4f electrons which form the valence shell. This shell lies deep inside the atom, with the result that influences from the surrounding solid are well screened off by the outer electrons, so that even in the solid the 4f shell behaves very much like a in free atom or ion, and is almost completely spherically symmetric. Perturbations from the solid environment however always disturb this symmetry to some extend, with the result that the absorption spectrum becomes dependent on the mutual orientation of the polarization vector of the radiation and the ion. Earlier the existence of a strong magnetic X-ray dichroism (MXD) in the 3d→4f transitions of rare earths. In this thesis this work is extended, to a small degree theoretically but mainly experimentally. MXD is used in experiments on bulk sample, terbium iron garnet, and on rare earth overlayers on a ferromagnetic surface, Ni(110). The results of the latter study show unequivocally the potential of the MXD technique. The second theme of the thesis concerns experimental developments in soft X-ray spectroscopy. A description is given of a double crystal monochromator beamline that was constructed by our group at LURE, France. Results of the use of an organic crystal - multilayer comination in such a monochromator is described. Also a method is described for the characterization of the resolution of soft X-ray monochromators. Finally a contribution to the characterization of the electron yield technique in the soft X-ray range is given. (author). 296 refs.; 64 figs.; 59 schemes; 9 tabs

Thick CrN/NbN multilayer coating deposited by cathodic arc technique

Energy Technology Data Exchange (ETDEWEB)

Araujo, Juliano Avelar; Tschiptschin, Andre Paulo; Souza, Roberto Martins, E-mail: antschip@usp.br [Universidade de Sao Paulo (USP), SP (Brazil); Lima, Nelson Batista de [Instituto de Pesquisas Energeticas e Nucleares (IPEN/CNEN-SP), Sao Paulo, SP (Brazil)

2017-01-15

The production of tribological nanoscale multilayer CrN/NbN coatings up to 6 μm thick by Sputtering/HIPIMS has been reported in literature. However, high demanding applications, such as internal combustion engine parts, need thicker coatings (>30 μm). The production of such parts by sputtering would be economically restrictive due to low deposition rates. In this work, nanoscale multilayer CrN/NbN coatings were produced in a high-deposition rate, industrial-size, Cathodic Arc Physical Vapor Deposition (ARC-PVD) chamber, containing three cathodes in alternate positions (Cr/ Nb/Cr). Four 30 μm thick NbN/CrN multilayer coatings with different periodicities (20, 10, 7.5 and 4 nm) were produced. The coatings were characterized by X-Ray Diffraction (XRD) and Transmission Electron Microscopy (TEM). The multilayer coating system was composed of alternate cubic rock salt CrN and NbN layers, coherently strained due to lattice mismatch. The film grew with columnar morphology through the entire stratified structure. The periodicities adopted were maintained throughout the entire coating. The 20 nm periodicity coating showed separate NbN and CrN peaks in the XRD patterns, while for the lower periodicity (≤10nm) coatings, just one intermediate lattice (d-spacing) was detected. An almost linear increase of hardness with decreasing bilayer period indicates that interfacial effects can dominate the hardening mechanisms. (author)

Glancing angle synchrotron X-ray diffraction

Energy Technology Data Exchange (ETDEWEB)

Cernik, R J [Daresbury Lab., Warrington, WA (United States)

1996-09-01

This paper describes in basic detail some of the techniques that can be used to study thin films and surfaces. These are all in the X-ray region and cover reflectivity, diffraction form polycrystalline films, textured films and single crystal films. Other effects such as fluorescence and diffuse scattering are mentioned but not discussed in detail. Two examples of the reflectivity from multilayers and the diffraction from iron oxide films are discussed. The advantages of the synchrotron for these studies is stressed and the experimental geometries that can be employed are described i detail. A brief bibliography is provided at the end to accompany this part of the 1996 Frascati school.

Glancing angle synchrotron X-ray diffraction

International Nuclear Information System (INIS)

Cernik, R.J.

1996-01-01

This paper describes in basic detail some of the techniques that can be used to study thin films and surfaces. These are all in the X-ray region and cover reflectivity, diffraction form polycrystalline films, textured films and single crystal films. Other effects such as fluorescence and diffuse scattering are mentioned but not discussed in detail. Two examples of the reflectivity from multilayers and the diffraction from iron oxide films are discussed. The advantages of the synchrotron for these studies is stressed and the experimental geometries that can be employed are described i detail. A brief bibliography is provided at the end to accompany this part of the 1996 Frascati school

Massive stars and X-ray pulsars

International Nuclear Information System (INIS)

Henrichs, H.

1982-01-01

This thesis is a collection of 7 separate articles entitled: long term changes in ultraviolet lines in γ CAS, UV observations of γ CAS: intermittent mass-loss enhancement, episodic mass loss in γ CAS and in other early-type stars, spin-up and spin-down of accreting neutron stars, an excentric close binary model for the X Persei system, has a 97 minute periodicity in 4U 1700-37/HD 153919 really been discovered, and, mass loss and stellar wind in massive X-ray binaries. (Articles 1, 2, 5, 6 and 7 have been previously published). The first three articles are concerned with the irregular mass loss in massive stars. The fourth critically reviews thoughts since 1972 on the origin of the changes in periodicity shown by X-ray pulsars. The last articles indicate the relation between massive stars and X-ray pulsars. (C.F.)

Application of the X-ray diffractometer DRON to the study of long period structures

International Nuclear Information System (INIS)

Gordelij, V.I.; Lushchikov, V.I.; Syrykh, A.G.; Cherezon, V.G.

1991-01-01

It is shown that the stock-produced X-ray diffractometer DRON can be adapted for the study of long period structures up to ∼150 A. The experimental data on small-angle diffraction spectra, measured on it, from both lamellar and lateral structures of biological and lipid membranes are reported. The data show that lattice constants of these structures could be determined within the accuracy of 1 A. 15 refs.; 7 figs

Density determination of langmuir-blodgett monolayer films using x-ray reflectivity technique