Sample records for IONES SILICIO (silicon ions)
from WorldWideScience.org

Sample records 1 - 16 shown.



1

ESTUDIOS POR MICROSCOPIA ELECTRONICA DE MATERIALES MESOPOROSOS CATALITICOS: EL EFECTO DE LA RELACION SO4/SiO2 EN LA SINTESIS DE LOS MISMOS

Acosta, D.R; Guzmán, M.L; Montoya, A; Armendáriz, H; Salas, P; Tobón, A
2001-12-01

Resumen en español Se prepararon sólidos mesoporosos de la familia de materiales MCM, por síntesis hidrotérmica variando la relación sulfato / silicio para estudiar el efecto de los iones sulfato en las características estructurales de los materiales obtenidos. Las muestras fueron caracterizadas usando, difracción de rayos X, adsorción de nitrógeno análisis termogravimetricos y microscopía electrónica de transmisión en condiciones de alta resolución. Se utilizó un programa com (mas) ercial de computo en el estudio y análisis de las micrografías de alta resolución. Se encontró que el aumento en la concentración de sulfato incrementa el espesor de las paredes de los túneles en nuestros materiales mesoporosos. Resumen en inglés Mesoporous materials of the MCM family were prepared by hydrothermal synthesis with variations in the Sulfate / Silicon ratio in order to study the effects of sulfate ions on structural characteristics. The samples were studied by X ray diffraction, N2 Adsorption, thermogravimetric analysis and electron microscopy in the high resolution modalitiy. A commercial computing program was used to study the high resolution electron micrographs. It was found that as the sulfate io (mas) n concentration increases in the starting compounds, the wall thickness of the tunnels grows in a continuous way..

Scientific Electronic Library Online (Spanish)

2

β-Delayed deuteron emission from 11Li: decay of the halo

Raabe, R.; Andreyev, A.; García Borge, María José; Buchmann, L.; Capel, P.; Fynbo, H. O. U.; Huyse, M.; Kanungo, R.; Kirchner, T.; Mattoon, C.; Morton, A..C.; Mukha, A.I.; Pearson, J.; Ponsaers, J.; Ressler, J.J.; Riisager, K.; Ruiz, C.; Ruprecht, G.; Sarazin, F.; Tengblad, Olof; Van Duppen, P.; Walden, P.
2008-11-18

Digital.CSIC (Spain)

3

Testing of a DSSSD detector for the stopped RISING project

Kumar, R.; Molina, Francisco G.; Pietri, S.; Casarejos, E.; Algora, Alejandro; Benlliure, J.; Doornenbal, P.; Gerl, J.; Gorska, M.; Kojouharov, I.; Podolyak, Z.; Prokopowicz, W.; Regan, P. H.; Rubio, Berta; Schaffner, H.; Tashenov, S.; Wollersheim, H. J.
2008-11-01

Digital.CSIC (Spain)

6

Production of ordered silicon nanocrystals by low-energy ion sputtering

Gago, Raul; Vázquez, Luis; Cuerno, Rodolfo; Varela, María; Ballesteros, Carmen
2001-05-21

Digital.CSIC (Spain)

8

Microscopic and macroscopic dielectric description of mixed oxide thin films

Ferrer, F. J.; Yubero Valencia, Francisco; Mejías, J. A.; García-López, F. J.; González-Elipe, Agustín R.
2007-10-30

Digital.CSIC (Spain)

9

Large enhancement of the third-order optical susceptibility in Cu-silica composites produced by low-energy high-current ion implantation

Olivares, J.; Requejo-Isidro, José; Coso López, Raúl del; Nalda, R. de; Solís Céspedes, Javier; Afonso, Carmen N.; Stepanov, A. L.; Hole, D.; Townsend, P. D.; Naudon, A.
2001-07-15

Digital.CSIC (Spain)

10

Fabrication of complementary metal-oxide-semiconductor integrated nanomechanical devices by ion beam patterning

Rius, G.; Llobet, J.; Borrisé, Xavier; Mestres Andreu, Narcís; Retolaza, A.; Merino, S.; Pérez Murano, Francesc
2009-12-02

Digital.CSIC (Spain)

11

Enhanced photoluminescence of nanostructured Er(3+)-doped a-Si/a-Al2O3 thin films prepared by PLD

Toudert, Johann; Núñez Sánchez, Sara; Serna, Rosalía; Jiménez de Castro, Miguel

5 pages, 5 figures.-- Presented as communication to: E-MRS 2007 Spring Meeting, Symposium C: Rare Earth Ion Doping for Photonics: Materials, Mechanisms and Devices (Strasbourg, May 28-Jun 1, 2007).-- Printed version published on Jan 2008. | Enhancement of the 1540 nm emission in nanostructured Er(3+...

DRIVER (Spanish)

12

Enhanced photoluminescence of nanostructured Er(3+)-doped a-Si/a-Al2O3 thin films prepared by PLD

Toudert, Johann; Núñez Sánchez, Sara; Serna, Rosalía; Jiménez de Castro, Miguel
2007-08-14

Digital.CSIC (Spain)

15

Complex dielectric function of ion implantation amorphized SiC determined by spectroscopic ellipsometry

Lohner, T.; Zolnai, Z.; Petrik, P.; Battistig, Gabor; García López, Francisco Javier; Morilla, Yolanda; Koós, A.; Osváth, Z.; Fried, M.
2008-03-17

Digital.CSIC (Spain)

16

Behavior of oxygen doped SiC thin films: An x-ray photoelectron spectroscopy study

Ávila, A.; Montero Herrero, Isabel; Galán, L.; Ripalda, J. María; Levy, R. A.
2001-01-01

Digital.CSIC (Spain)