A test stand for Ion sources of ultimate reliability

Enparantza, R.; Uriarte, L.; Bermejo, Francisco Javier; Etxebarria, V.; Lucas, J.; Rio, J. M. del; Letchford, A.; Faircloth, D.; Stockli, M.; Romano, P.; Alonso, J.; Ariz, I.; Egiraun, M.
2009-03-12

Digital.CSIC (Spain)