Ultra-low Resistance Contacts to GaAs/AlGaAs Quantized Hall Resistors
Lee, K.; Electrochemical Society
German National Library of Science and Technology (GetInfo) (German)
Thin-film resistance thermometers on silicon wafers
Kenneth G Kreider; Dean C Ripple; William A Kimes
The characteristic potential method of noise calculation in multi-terminal homogeneous semiconductor resistors
C H Park; Y S Kim; M S Chae
Stress and Other Challenges with Evaporated Ni-Cr Thin Film Resistors Used in the Manufacture of ASICs
Bilir, N.; Do, L.
Strain sensitivity in film and cermet resistors: measured and physical quantities
B Morten; M Prudenziati; A Taroni
Static NMOS circuits for crossbar architectures using silicon nano-wire technology
Ahmet Bindal; Sotoudeh Hamedi-Hagh
Simulation of a high-voltage semiconductor resistor in development of power tab-shaped silicon resistors
Batyaev, P.; Chibirkin, V.; Geifman, E.
Series addition of ballistic resistors
P C Main; P H Beton; B R Snell
Quasi-monolithic integration of high-power GaN-based HEMTs for high-frequency applications
Alexander Kricke; Mojtaba Joodaki; Nethaji Dharmarasu
Quasi-Random Resistor Network Model for Linear Magnetoresistance of Metal–Semiconductor Composite
Xu Jie; Zhang Duan-Ming; Deng Zong-Wei
Piezoresistive response induced by piezoelectric charges in n-type GaAs mesa resistors for application in stress transducers
Lu, S. S.; Hsu, Y. W.; Chang, P. Z.
Oxide Semiconductor Gas Sensors
Yamazoe, Noboru; Shimanoe, Kengo; Sakai, Go
Numerical and Analytical Modelling of Head Resistances of Diffused Resistors
Witkowski, U.; Schroeder, D.
Neutron and proton irradiation of shallow channel GaAs direct‐coupled field‐effect‐transistor logic devices and circuits
Bland, S. W.; Galashan, A. F.
Modeling of three-dimensional diffusible resistors with the one-dimensional tube multiplexing method
Jean-Numa Gillet; Jean-Yves Degorce; Michel Meunier
Microminiaturization by thin film and solid circuit techniques
G W A Dummer
Metastable silicon–transition-metal films as temperature-independent resistors
Collver, M. M.
Manufacturing Methods for Chrome Silicon Film Resistors for Radiation Hardened Circuits
Ammon, George M.; Harris Semiconductor Melbourne Fla
Manufacturing Methods and Processes for High Resistivity Thin Film Resistors for Radiation Hardened Integrated Circuits
Marshall, Robert W.; Uyeda, Osamu; Waits, R. K.
Low-Frequency Noise Characterization of Very Large Value Resistors
Arnaboldi, C.; Bucci, C.; Cremonesi, O.
Laser-Induced Resistance Fine Tuning of Integrated Polysilicon Thin-Film Resistors
Boulais, E; Fantoni, J; Chateauneuf, A
Kelvin probe force microscopy for potential distribution measurement of semiconductor devices
Tanimoto, Masafumi; Vatel, Olivier
Impact of plasma-enhanced chemical vapor deposited oxide characteristics on interconnect via resistance and device performance of four-transistor static random access memory with polysilicon load resistors
Lin, C.-F.; Tseng, W. T.; Fang, M. S.
Hot-carrier fluctuations from ballistic to diffusive regime in submicron semiconductor structures
L Varani; L Reggiani; P Houlet
Giant geometrically amplified piezoresistance in metal-semiconductor hybrid resistors
Hansen, Ole; Reck, Kasper; Thomsen, Erik V.
Fluctuating deep‐level trap occupancy model for Hooge’s 1/f noise parameter for semiconductor resistors
Folkes, Patrick A.
Fluctuating deep‐level trap occupancy model for 1/f noise in semiconductor resistors
Folkes, P. A.
Flicker Noise and Low-Frequency Nonequilibrium Conductivity Fluctuations in Thin Films Ta~xN~y Resistors
Zhigalskii, G. P.; Karev, A. V.; Semiconductor Physics Institute
Fabrication and Characterization of Thin Film Resistors for GaAs-Based Power Amplifiers
Shen, H.; Arreaga, J.; Ramanathan, R.
Electrical conduction in thick film resistors
O Abe; Y Taketa
Development and TCR Control of Nichrome Thin Film Resistors for GaAs MMICs
Vinayak, S.; Srivastav, R. D.; Sehgal, B. K.
Conductance fluctuations near the localized-to-extended transition in narrow Si metal-oxide-semiconductor field-effect transistors
Kastner, M. A.; Kwasnick, R. F.; Licini, J. C.
Comparison of Diodes and Resistors for Measuring Chip Temperature During Thermal Characterization of Electronic Packages Using Thermal Test Chips
Claassen, A.; Shaukatullah, H.; IEEE
Characterisation of "Equilibrated" Thick Film Resistors
Hrovat, M.; Holc, J.; Samardzija, Z.
Broad Band Modelling of NiCr Resistors
Sharma, R.; Vinayak, S.; Kumar, A.
Anomalous electrical conduction in silicon resistors at low temperatures
D Tsamakis; N Glezos
An Improved Two-Resistors Compact Thermal Model By Means of Modified Top-Surface-Area
Tal, Y.; IEEE
Ambient‐induced surface effects on InP and GaAs
Kim, T. S.; Streetman, B. G.; Lester, S. D.
A Laser-Trimmed Rail-to-Rail Precision CMOS Operational Amplifier
Singh, R; Audet, Y; Gagnon, Y
1/f Noise in p-n Junctions and Diffusive Resistors Formed on Wafers Containing Swirle Defects
Leont'ev, G. E.; Semiconductor Physics Institute; Vilnius University
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