Techniques for Improving SIMS Depth Resolution: C 60+ Primary Ions and Backside Depth Profile Analysis
Fahey, Albert; Windsor, Eric; Bright, David
German National Library of Science and Technology (GetInfo) (German)
Structural and chemical analysis of ion beam produced conductive regions on highly resistive organic films
Wilkens, B. J.; Venkatesan, T.; Rupp, L.
Lifetime measurements of the 2P13 state in heliumlike silicon and sulphur
Varghese, S. L.; Cocke, C. L.; Curnutte, B.
High intensity metallic ion beams from an ECR ion source at GANIL
Huguet, Y.; Lecesne, N.; Lehérissier, P.
Fabrication of RF MEMS variable capacitors by deep X-ray lithography and electroplating
Mappes, Timo; Wells, Garth; Klymyshyn, David
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