Sample records for MEHRNIVEAUANALYSE (multilevel analysis)
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2

Was kann man am Beispiel des SOEP bezüglich Nonresponse lernen?

Schräpler, Jörg-Peter

"Die vorliegende Untersuchung beschäftigt sich mit dem Ausfallprozeß in der Basiserhebung des Sozio-oekonomischen Panels (SOEP). Neben einer detaillierten Deskription der Ausfälle in der ersten Welle, werden Multilevelmodelle verwendet, um den Prozeß der Interviewteilnahme in Abhängigkeit von Befrag...

DRIVER (German)

29

Multilevel Nonparametric Pattern Recognition Systems

Lapko, A. V.; Chentsov, S. V.; Russian Academy of Sciences; Scientific Council on Cybernetics
1999-01-01

German National Library of Science and Technology (GetInfo) (German)

30

Multilevel Factor Analysis Modelling Using Markov Chain Monte Carlo Estimation

Goldstein, H.; Browne, W.; Society for Multivariate Analysis in the Behavioural Sciences
2002-01-01

German National Library of Science and Technology (GetInfo) (German)

31

Modelling Measurement Error in Structural Multilevel Models

Fox, J.-P.; Glas, C. A. W.; Society for Multivariate Analysis in the Behavioural Sciences
2002-01-01

German National Library of Science and Technology (GetInfo) (German)

71

Alcohol Use in Swedish Halls of Residence

Ståhlbrandt, Henrietta

In the year 2000, the alcohol habits of 1460 Swedish university students living in residence halls were assessed. The students had a mean age of 23.8 years, and 64% were male. The results from this baseline assessment show that the mean AUDIT score (± sd) was 10.3 ± 5.2 for males and 8.1 ± 4.7 for f...

DRIVER (German)

85

6.B Simulation and Analysis of Physical Vapor Deposition Over Sub-Micron Features

Coronell, D. G.; Egan, E. W.; Institute Microelectronics Inter-On Chip Connection (IMIC)
2000-01-01

German National Library of Science and Technology (GetInfo) (German)

98

"On the Reliability and Failure Analysis of Very Large Scale Integrated Circuits"

Jahanian, S.; Chatterjee, K.; Institute Microelectronics Inter-On Chip Connection (IMIC)
2003-01-01

German National Library of Science and Technology (GetInfo) (German)

99

"Incoming Inspection and Failure Analysis of CMP Consumables at the Semiconductor Fab"

Gitis, N. V.; Vinogradov, M.; Institute Microelectronics Inter-On Chip Connection (IMIC)
2003-01-01

German National Library of Science and Technology (GetInfo) (German)