Sample records for SPEICHEREINHEITEN (memory devices)
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24

Reliability Issues of Floating Gate Flash Memory (Invited)

Chang, C.; Japan Society of Applied Physics; IEEE; Electron Devices Society
1998-01-01

German National Library of Science and Technology (GetInfo) (German)

25

Records of the IEEE International Workshop on Memory Technology, Design and Testing : August 8 - 9, 1994, San Jose, California

International Workshop on Memory Technology, Design and Testing < 2, 1994, San José, Calif.>; Computer Society / Test Technology Technical Committee; Computer Society / Technical Committee on VLSI
1994-01-01

German National Library of Science and Technology (GetInfo) (German)

26
28

Records of the 1995 IEEE International Workshop on Memory Technology, Design and Testing : August 7 - 8, 1995, San Jose, California

International Workshop on Memory Technology, Design and Testing < 3, 1995, San José, Calif.>; Computer Society / Test Technology Technical Committee
1995-01-01

German National Library of Science and Technology (GetInfo) (German)

29

Records of the 1993 IEEE International Workshop on Memory Testing : August 9 - 10, 1993, San Jose, California

International Workshop on Memory Testing < 1993, San José, Calif.>; Computer Society / Test Technology Technical Committee
1993-01-01

German National Library of Science and Technology (GetInfo) (German)

34

Proceedings 1996 conference - Sixth Biennial IEEE International Nonvolatile Memory Technology Conference : June 24 - 26, 1996, Albuquerque, NM, USA

International Nonvolatile Memory Technology Conference < 6, 1996, Albuquerque, NM>; Components, Packaging, and Manufacturing Technology Society; Institute of Electrical and Electronics Engineers
1996-01-01

German National Library of Science and Technology (GetInfo) (German)

61

Guide-Lines on Flash Memory Cell Selection (Invited)

Yoshikawa, K.; Japan Society of Applied Physics; IEEE; Electron Devices Society
1998-01-01

German National Library of Science and Technology (GetInfo) (German)

85

A System Chip Innovation by the Ferroelectric Memory Technology (Invited)

Matsumoto, I.; Japan Society of Applied Physics; IEEE; Electron Devices Society
1998-01-01

German National Library of Science and Technology (GetInfo) (German)