Sample records for MASSENDEFEKT (mass defect)
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18

Proceedings - 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, November 6 - 8, 1996, Boston, Massachusetts

International Symposium on Defect and Fault Tolerance in VLSI Systems < 1996, Boston, Mass.>; Institute of Electrical and Electronics Engineers; Computer Society / Technical Committee on Fault Tolerant Computing
1996-01-01

German National Library of Science and Technology (GetInfo) (German)

19

Proceedings - 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 3 - 5 November 2003, Boston, Massachusetts

International Symposium on Defect and Fault Tolerance in VLSI Systems < 18, 2003, Boston, Mass.>; Computer Society / Technical Committee on Fault Tolerant Computing; Computer Society / Test Technology Technical Council
2003-01-01

German National Library of Science and Technology (GetInfo) (German)