X-ray topographic observation of dark-line defects in GaAs-Ga 1−xAl xAs double-heterostructure wafers
Ito, Ryoichi; Kishino, Seigo^; Nakashima, Hisao
German National Library of Science and Technology (GetInfo) (German)
Wavelength-drop properties of L-type defects in photonic bandgap structure for the terahertz regime
Yuan-Xun, Li; Dong-Bing, Tian; Wei-Wei, Ling
Vacancy-type defects in strained-Si layers deposited on SiGe/Si structures probed by using monoenergetic positron beams
Ohdaira, Toshiyuki; Ishibashi, Shoji; Uedono, Akira
Two fully bleachable zero-phonon-line defects in NaF: Possible candidates for highly efficient photochemical hole burning
Kaipa, Prasad; Lüty, Fritz
Treatment of quality defects of No. 6∼No. 8 tunnels of the Main Line in Shanxi Wanjiazhai Yellow River Diversion Project
Wang Xiequn,; Wen Jiahua,; Wang Zhao,
Transmission electron microscopy of 〈100〉 dark line defects in CdZnSe quantum well structures
Haase, M. A.; Law, K. K.; Haugen, G. M.
The identification of dark‐line defects in AlGaAs/InGaAs/GaAs heterostructures
Ast, D. G.; Fitzgerald, E. A.; Eastman, L. F.
The basic science of the subchondral bone
Madry, Henning; Mueller-Gerbl, Magdalena; Dijk, C.
The Study on GDI/GDI+ Rendering Function Defects and How to Avoid Them
Qingyuan Li,; Hai Tan,
The Repair of Pipeline Defects and Damage using the Epoxy-Filled Sleeve Repair
Corder, I.; Hopkins, P.; American Gas Association; Pipeline Research Committee
The European Pipeline Research Group's Guidelines on Acceptable Girth Weld Defects in Transmission Pipelines
Hopkins, P.; American Gas Association; Pipeline Research Committee
The EPRG guidelines on defects in transmission pipeline girth welds
Knauf, G.; Hopkins, P.; European Pipeline Research Group
Testing and Diagnosis of Realistic Defects in Digital Microfluidic Biochips
Hwang, William; Mukherjee, Arindam; Su, Fei
Temperature dependences of line widths and peak positions of optical absorption peaks due to localized vibration of hydrogen Si
Suezawa, M.; Fukata, N.; Saito, M.
Strain relief by long line defects in tensile GaxIn1-xP layers grown on InP substrates
Ritter, D.; Kahn, M.
Static electric field gradients and associated magnetic-resonance line-shape changes due to a random distribution of point defects
Fedders, Peter A.
Spectral shifts associated with dark line defects in degraded II-VI laser diodes
Pashley, M.; Petruzzello, J.; Cargill, G. S.
Spatial variations of photoluminescence line broadening around oval defects in GaAs/AlGaAs multiple quantum wells
J E M Haverkort; M P Schuwer; M R Leys
Simple kinetic Monte Carlo models for dissolution pitting induced by crystal defects
Meakin, Paul; Rosso, Kevin M.
Scattering of Rayleigh waves by surface defects
Steg, R. G.; Klemens, P. G.
Residual Magnetic Flux Leakage: A Possible Tool for Studying Pipeline Defects
Babbar, Vijay; Clapham, Lynann
Relaxation of Coherency Strains in Metallic Diffusion Fields Via Point, Line and Surface Defects
Kirkaldy, J. S.; Metallurgical Society
Propagation of light beams along line defects formed in a-Si/SiO2 three-dimensional photonic crystals: Fabrication and observation
Hanaizumi, Osamu; Ohtera, Yasuo; Sato, Takashi
Point and ring defects in nematics under capillary confinement
Rey, Alejandro D.; De Luca, Gino
Point and Line Disclinations in Models of the Blue Phases
Collings, P. J.; US National Science Foundation and Technology Center on Advanced Liquid Crystalline Optical Materials
Photoluminescence Line Narrowing in the Non-Bridging Oxygen Center in Glassy SiO~2
Phonon Scattering by Line Defects
Agrawal, Bal Krishna
Optical excitations of defects in realistic nanoscale silica clusters: Comparing the performance of density functional theory using hybrid functionals with correlated wavefunction methods
Zwijnenburg, M. A.; Sousa, C.; Sokol, A. A.
On-Line Testing of Lab-on-Chip Using Reconfigurable Digital-Microfluidic Compactors
Chakrabarty, Krishnendu; Zhao, Yang
On the point and line defects which are common to both degraded light emitting diodes and plastically deformed GaAs
On Guided Waves Created by Line Defects
Miao, Dong; Ma, Fuming
Observation on Defects in Poly-Si Films Prepared by RTCVD Under Nonideal Conditions
Deng, You-Jun; Shen, Hui; Liang, Xue-Qin
Observation and electronic characterization of ‘‘new’’ E′ center defects in technologically relevant thermal SiO2 on Si: An additional complexity in oxide charge trapping
Lowry, R. K.; Lenahan, P. M.; Evans, H. L.
Noble-gas-related defects in Si and the origin of the 1018 meV photoluminescence line
Estreicher, S. K.; Weber, J.; Derecskei-Kovacs, A.
New Resonance Line Shape in Semi-Infinite Media Due to Defect Inhomogeneous Broadening: Sm^2^+ Luminescence in CaF~2 Films
Averkiev, N. S.; Vikhnin, V. S.; Sokolov, N. S.
Nature of dark defects revealed in InGaAsP/InP double heterostructure light emitting diodes aged at room temperature
Kotani, Tsuyoshi; Umebu, Itsuo; Ueda, Osamu
Locating Defects in High Voltage Transmission Lines
Localization of defects using checkerboard test structures [4406-26]
Schellenberg, S.-O.; SPIE
Line defects of a two-component vector order parameter
Duan, Yishi; Zhang, Hong
Line defects in two-dimensional four-beam interference patterns
C Tan; C S Peng; V N Petryakov
Line defects in quasi-one-dimensional systems: Orthogonality exponents and electron density
Line defects in epitaxial silicon films grown at Formula Not Shown
Petter, K.; Eyidi, D.; Stoger-Pollach, M.
Line Defects Separating Distinct Interfacial Structures: Topological Character and Diffusive Flux Considerations
Antonopoulos, J.G.; Pond, R.C.; Karakostas, Th.
Large polysilicon grain defects in gate deposition due to prior contamination [4406-30]
Terryll, K.; Garcia, M. A.; Dominguez, P. S.
Knochendefekte beim Knieendoprothesenwechsel: Klassifikation und Management
Reichel, H.; Hube, R.; Birke, A.
Kinetic Monte Carlo and density functional study of hydrogen enhanced dislocation glide in silicon
Scarle, S.; Ewels, C. P.
Interactions of Moving Dislocations in Semiconductors with Point, Line and Planar Defects
Hull, R.; Stach, E. A.; Tromp, R.
Inherent paramagnetic defects in layered Si/SiO2 superstructures with Si nanocrystals
Jivanescu, M.; Stesmans, A.; Zacharias, M.
Influence of line defects on focusing in a two-dimensional photonic-crystal flat lens
In-line material analysis of 50nm defects by integration of Energy (EDX) and Wavelength (WDX) Dispersive X-ray analysis
Levin, Lior; Eilon, Michal; Porat, Ronnie
In-Line Characterization of Aluminum and Tin Films for Reliable ULSI Interconnects
Ramaswami, S.; The Electrochemical Society; Electronics and Dielectric Science and Technology Divisions
Hyperspectral reflectance and fluorescence line-scan imaging for online defect and fecal contamination inspection of apples
Chan, Diane; Kim, Moon; Lefcourt, Alan
Growth of slip surfaces and line inclusions along shear bands in a softening material
Dal Corso, F.; Bigoni, D.
Fourier modelling of the anisotropic line broadening of X-ray diffraction profiles due to line and plane lattice defects
Leoni, Matteo; Scardi, Paolo
Formation of topological defects in thin superconducting rings
Berger, J.; Rubinstein, J.
Formation of topological defects
Formation and distribution of point defects on a disclination line near a free nematic interface
Ignés-Mullol, Jordi; Baudry, Jean; Oswald, Patrick
Flux pinning and phase transitions in model high-temperature superconductors with columnar defects
Lee, K. H.; Stroud, D.; Girvin, S. M.
Fluorescence Line Narrowing of Cr^3^+-Doped Gadolinium Scandium Aluminium Garnet in a Magnetic Field
Yamaga, M.; Ogihara, C.; Gao, Y.
Flatness measuring systems, automatic recognition and quantification of flatness defects of heavy plates
Haralamb, H. G.; ECSC
Exploring the syndrome of spatial unilateral neglect through an illusion of length
Cappa, Stefano; Daini, Roberta; Angelelli, Paola
Energetics of Ni-Induced Vacancy Line Defects on Si(001)
Zandvliet, H. J. W.; Louwsma, H. K.; Hegeman, P. E.
Energetics and electronic structure of armchair nanotubes with topological line defects
Susumu Okada; Kyoko Nakada; Takazumi Kawai
Endoscopic Reconstruction of Skull Base Defects with the Nasal Septal Flap
El-Sayed, Ivan H; Roediger, Fredrick C; Goldberg, Andrew N
Elimination of dark line defects in lattice‐mismatched epilayers through use of strained‐layer superlattices
Gourley, P. L.; Biefeld, R. M.; Dawson, L. R.
Electronic structure of line defects by means of the scattering theoretical method. Application to lines of vacancies in the simple cubic lattice
Louis, E.; Vergés, J. A.
Electron paramagnetic resonance line shape investigation of the ^2^9Si hyperfine doublet of the E'~g~a~m~m~a center in a-SiO~2
Buscarino, G.; Agnello, S.; Parlato, A.
Electron paramagnetic resonance characterization of defects produced by ion implantation into silicon
R C Barklie; C O’Raifeartaigh
Electron and Phonon Bound States and Scattering Resonances for Extended Defects in Crystals
Brown, R. A.
Effects of defects generated in ALD TiO 2 films on electrical properties and interfacial reaction in TiO 2 /SiO 2 /Si system upon annealing in vacuum
Lee, Chongmu; Go, Seunghee; Lee, Eungu
Dynamics and depinning of the triple contact line in the presence of periodic surface defects
Vadim S Nikolayev
Defects in silicon after B+ implantation: A study using a positron-beam technique, Rutherford backscattering, secondary neutral mass spectroscopy, and infrared absorption spectroscopy
Eichler, S.; Gebauer, J.; Börner, F.
Defect structure of high-Tc superconductor by high-energy heavy ion irradiation
Sasase, Masato; Okayasu, Satoru; Kurata, Hiroki
Defect Inspection in Low-Contrast LCD Images Using Hough Transform-Based Nonstationary Line Detection
Wei-Chen Li,; Du-Ming Tsai,
Dark defects in InGaAsP/InP double heterostructure lasers under accelerated aging
Iwane, G.; Fukuda, M.; Wakita, K.
Curvature defects in lamellar phases of amphiphile-water systems
Ben‐Shaul, Avinoam; Roux, Didier; Gelbart, William M.
Critical-current anisotropy due to inclined and crossed linear defects
Schuster, Thomas; Kuhn, Holger; Indenbom, Mikhail
Creating line defects with a single micro-sphere width in a DNA-linked 2D colloidal crystal array using a pulsed laser
Marcus, Harris; Yu, Phillip; Kim, Sejong
Congenital Abdominal Wall Defects: An Update
Johnson, Mark P.; Wilson, R. Douglas
Composite Reinforcement of Pipeline Corrosion Defects: New Insights into Reinforced Defect Behavior
Stephens, D. R.; Francini, R.; Roy, S.
Characterization of Missing-poly Defects in Ion Implantation in ULSI Manufacturing
Zhao, Z. Y.; Anundson, Rick; Dunham, Brian
Bioabsorbable Glycolide Copolymer Staple-Line Reinforcement Decreases Internal Hernia Rate After Laparoscopic Roux-en-Y Gastric Bypass
Johnson, Joseph; Rickards, Gretchen; Boss, Thad
Automatic Detection of Defects in Solar Modules: Image Processing in Detecting
Bei Nian,; Zhizhong Fu,; Li Wang,
Automated process parameter resetting for injection moulding: a fuzzy-neuro approach
ZHANG, Y. F.; NEE, A. Y. C.; FUH, J. Y. H.
Approach of Tibial Bone Defects in Primary Total Knee Arthroplasty
Georgeanu, V; Predescu, V; Atasiei, T
Anomalous zero-phonon line broadening of the (NV)^- center in diamond
Nishikori, H.; Mita, Y.; Nisida, Y.
Annihilation of grown‐in defects in Czochralski‐grown silicon probed with variable‐energy positron beam
Tanigawa, S.; Saito, S.; Kitano, T.
Anisotropic elastic solutions for line defects in high-symmetry cases
Lothe, J.; Hirth, J.P.
An automatic optical inspection of drill point defects for micro-drilling
Tarng, Y.; Liao, C.; Huang, C.
An algebraic approach to multiple defects on the line and application to the Casimir force
M Mintchev; E Ragoucy
An EPR study of defects induced in 6H-SiC by ion implantation
Collins, M.; Skorupa, W.; Pacaud, Y.
Acceptor-related luminescence at 3.314eV in zinc oxide confined to crystallographic line defects
Schirra, M.; Schneider, R.; Reiser, A.
A review of in-line/off-line defect characterization techniques applied to control and improve electronic grade silicon wafer manufacturing processes
A fatigue crack-initiation criterion for the assessment of the residual life of gas transmission pipelines with `gouge only' or `gouge in dent' defects
Batisse, R.; Meziere, Y.; De France, G.
1D-based defect detection in patterned TFT-LCD panels using characteristic fractal dimension and correlations
Tsai, Du-Ming; Chuang, Su-Ta
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