X-ray photoelectron spectroscopy study on SiO 2/ Si interface structures formed by three kinds of atomic oxygen at 300 °C

Kobayashi, K.; Takahashi, K.; Shin, S.
2004-01-01

German National Library of Science and Technology (GetInfo) (German)

The detection of fast neutral fragments following the photodissociation of krypton cluster ions

Stace, A. J.; Winkel, J. F.; Smith, J. A.
1994-01-01

German National Library of Science and Technology (GetInfo) (German)