Streaked spectrometry using multilayer x-ray-interference mirrors to investigate energy transport in laser-plasma applications

International Nuclear Information System (INIS)

Stradling, G.L.; Barbee, T.W. Jr.; Henke, B.L.; Campbell, E.M.; Mead, W.C.

1981-08-01

Transport of energy in laser-produced plasmas is scrutinized by devising spectrally and temporally identifiable characteristics in the x-ray emission history which identify the heat-front position at various times in the heating process. Measurements of the relative turn-on times of these characteristics show the rate of energy transport between various points. These measurements can in turn constrain models of energy transport phenomena. We are time-resolving spectrally distinguishable subkilovolt x-ray emissions from different layers of a disk target to examine the transport rate of energy into the target. A similar technique is used to measure the lateral expansion rate of the plasma spot. A soft x-ray streak camera with 15-psec temporal resolution is used to make the temporal measurements. Spectral discrimination of the incident signal is provided by multilayer x-ray interference mirrors

Multilayer mirrors as power filters in insertion device beamlines

International Nuclear Information System (INIS)

Kortright, J.B.; DiGennaro, R.S.

1988-08-01

The power-filtering capabilities of multilayer band-pass x-ray mirrors relative to total reflection low-pass mirrors is presented. Results are based on calculations assuming proposed wiggler sources on the upcoming generation of low energy (1.5 GeV) and high energy (7.0 GeV) synchrotron radiation sources. Results show that multilayers out-perform total reflection mirrors in terms of reduction in reflected power by roughly an order of magnitude, with relatively small increases in total absorbed power and power density over total reflection mirrors, and with comparable reflected flux values. Various aspects of this potential application of multilayer x-ray optics are discussed. 13 refs., 3 figs., 1 tab

High reflectance Cr/C multilayer at 250 eV for soft X-ray polarimetry

Energy Technology Data Exchange (ETDEWEB)

Wen, Mingwu; Jiang, Li; Zhang, Zhong; Huang, Qiushi [MOE Key Laboratory of Advanced Micro-Structured Materials, Institute of Precision Optical Engineering (IPOE), School of Physics Science and Engineering, Tongji University, Shanghai 200092 (China); Wang, Zhanshan, E-mail: wangzs@tongji.edu.cn [MOE Key Laboratory of Advanced Micro-Structured Materials, Institute of Precision Optical Engineering (IPOE), School of Physics Science and Engineering, Tongji University, Shanghai 200092 (China); She, Rui; Feng, Hua [Department of Engineering Physics, Tsinghua University, Beijing (China); Wang, Hongchang [Diamond Light Source, Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE (United Kingdom)

2015-10-01

X-ray reflection near 45° via multilayer mirrors can be used for astronomical polarization measurements. A Cr/C multilayer mirror (designed for X-ray polarimetry at 250 eV), with a period thickness of 3.86 nm and a bi-layer number of 100, was fabricated using direct current magnetron sputtering. Grazing incidence X-ray reflectometry at 8 keV and transmission electron microscopy were used to investigate the multilayer structure. Different models were introduced to fit the hard X-ray reflectivity curve, which indicates that the layer thickness of two materials slightly drifts from the bottom to the top of the stack. Both the chromium and carbon layers are amorphous with asymmetric interfaces, while the Cr-on-C interface is slightly wider. Based on the good quality of the multilayer structure, a high reflectivity of 21.8% for the s-polarized light was obtained at 250 eV at a grazing incidence angle of 40.7°. The fabricated Cr/C multilayer mirror exhibits high reflectivity and polarization levels in the energy region of 240 eV–260 eV. - Highlights: • We fabricated Cr/C multilayer with 3.8 nm d-spacing. • X-ray reflectometry was used to determine the exact structure of Cr/C multilayer. • A high reflectivity of 21.8% for the s-polarized light was obtained at 250 eV. • Both Cr and C were found to be amorphous with slightly asymmetric interfaces. • A 4-layer model was used to fit and explain the results.

Measured reflectance of graded multilayer mirrors designed for astronomical hard X-ray telescopes

DEFF Research Database (Denmark)

Christensen, Finn Erland; Craig, W.W.; Windt, D.L.

2000-01-01

Future astronomical X-ray telescopes, including the balloon-borne High-Energy Focusing Telescope (HEFT) and the Constellation-X Hard X-ray Telescope (Con-X HXT) plan to incorporate depth-graded multilayer coatings in order to extend sensitivity into the hard X-ray (10 less than or similar to E less......-graded W/Si multilayers optimized for broadband performance up to 69.5 keV (WK-edge). These designs are ideal for both the HEFT and Con-X HXT applications. We compare the measurements to model calculations to demonstrate that the reflectivity can be well described by the intended power law distribution...

High-energy x-ray microscopy with multilayer reflectors (invited)

International Nuclear Information System (INIS)

Underwood, J.H.

1986-01-01

A knowledge of the spatial distribution of the x rays emitted by the hot plasma region is a key element in the study of the physical processes occurring in laser-produced plasmas and complements other diagnostics such as spectroscopy and temporal studies. X-ray microscopy with reflection microscopes offers the most direct means of obtaining this information. Until recently, the two types of microscopes that had been developed for this purpose, the Kirkpatrick--Baez and the Wolter, operated at relatively low energies (about 4--5 keV) and had very little spectral selectivity, relying on filters for coarse spectral resolution. With the development of x-ray reflecting multilayer mirrors, the energy response of such microscopes can be extended to 10 keV or higher, with good spectral selectivity. In addition, it is possible to reduce some of the optical aberrations to obtain improved spatial resolution. This paper describes some of the recent progress in making and evaluating x-ray reflectors, and outlines the optical design considerations for multilayer-coated microscopes. Results from a prototype multilayer K--B microscope are presented

Compensation of X-ray mirror shape-errors using refractive optics

Energy Technology Data Exchange (ETDEWEB)

Sawhney, Kawal, E-mail: Kawal.sawhney@diamond.ac.uk; Laundy, David; Pape, Ian [Diamond Light Source, Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE (United Kingdom); Dhamgaye, Vishal [Indus Synchrotrons Utilisation Division, Raja Ramanna Centre for Advanced Technology, Indore 452012 (India)

2016-08-01

Focusing of X-rays to nanometre scale focal spots requires high precision X-ray optics. For nano-focusing mirrors, height errors in the mirror surface retard or advance the X-ray wavefront and after propagation to the focal plane, this distortion of the wavefront causes blurring of the focus resulting in a limit on the spatial resolution. We describe here the implementation of a method for correcting the wavefront that is applied before a focusing mirror using custom-designed refracting structures which locally cancel out the wavefront distortion from the mirror. We demonstrate in measurements on a synchrotron radiation beamline a reduction in the size of the focal spot of a characterized test mirror by a factor of greater than 10 times. This technique could be used to correct existing synchrotron beamline focusing and nanofocusing optics providing a highly stable wavefront with low distortion for obtaining smaller focus sizes. This method could also correct multilayer or focusing crystal optics allowing larger numerical apertures to be used in order to reduce the diffraction limited focal spot size.

Cr/B{sub 4}C multilayer mirrors: Study of interfaces and X-ray reflectance

Energy Technology Data Exchange (ETDEWEB)

Burcklen, C.; Meltchakov, E.; Jérome, A.; Rossi, S. de; Delmotte, F. [Laboratoire Charles Fabry, Institut d' Optique Graduate School, CNRS, Université Paris-Saclay, 91127 Palaiseau Cedex (France); Soufli, R. [Laboratoire Charles Fabry, Institut d' Optique Graduate School, CNRS, Université Paris-Saclay, 91127 Palaiseau Cedex (France); Lawrence Livermore National Laboratory, 7000 East Avenue, Livermore, California 94550 (United States); Dennetiere, D.; Polack, F.; Capitanio, B.; Thomasset, M. [Synchrotron SOLEIL, L' Orme des Merisiers, Saint Aubin, BP 48F-91192 Gif sur Yvette Cedex (France); Gullikson, E. [Center for X-ray Optics, Lawrence Berkeley National Laboratory, 1 Cyclotron Rd., Berkeley, California 94720 (United States)

2016-03-28

We present an experimental study of the effect of layer interfaces on the x-ray reflectance in Cr/B{sub 4}C multilayer interference coatings with layer thicknesses ranging from 0.7 nm to 5.4 nm. The multilayers were deposited by magnetron sputtering and by ion beam sputtering. Grazing incidence x-ray reflectometry, soft x-ray reflectometry, and transmission electron microscopy reveal asymmetric multilayer structures with a larger B{sub 4}C-on-Cr interface, which we modeled with a 1–1.5 nm thick interfacial layer. Reflectance measurements in the vicinity of the Cr L{sub 2,3} absorption edge demonstrate fine structure that is not predicted by simulations using the currently tabulated refractive index (optical constants) values for Cr.

Reactive diffusion in Sc/Si multilayer X-ray mirrors with CrB2 barrier layers

International Nuclear Information System (INIS)

Pershyn, Y.P.; Zubarev, E.N.; Kondratenko, V.V.; Sevryukova, V.A.; Kurbatova, S.V.

2011-01-01

Processes undergoing in Sc/Si multilayer X-ray mirrors (MXMs) with periods of ∝27 nm and barrier layers of CrB 2 0.3- and 0.7-nm thick within the temperature range of 420-780 K were studied by methods of small-angle X-ray reflectivity (λ=0.154 nm) and cross-sectional transmission electron microscopy. All layers with the exception of Sc ones are amorphous. Barrier layers are stable at least up to a temperature of 625 K and double the activation energy of diffusional intermixing at moderate temperatures. Introduction of barriers improves the thermal stability of Sc/Si MXMs at least by 80 degrees. Diffusion of Si atoms through barrier layers into Sc layers with formation of silicides was shown to be the main degradation mechanism of MXMs. A comparison of the stability for Sc/Si MXMs with different barriers published in the literature is conducted. The ways of further improvement of barrier properties are discussed. (orig.)

Interface characterization in B-based multilayer mirrors for next generation lithography

International Nuclear Information System (INIS)

Naujok, Philipp; Yulin, Sergiy; Müller, Robert; Kaiser, Norbert; Tünnermann, Andreas

2016-01-01

The interfaces in La/B_4C and LaN/B_4C multilayer mirrors designed for near normal incidence reflection of 6.x nm EUV light were investigated by grazing incidence X-ray reflectometry, high-resolution transmission electron microscopy and EUV reflectometry. The thickness and roughness asymmetries of the different interfaces in both studied systems have been identified. A development of interface roughness with an increasing number of bilayers was found by different investigation methods. For near normal incidence, R = 51.1% @ λ = 6.65 nm could be reached with our La/B_4C multilayer mirrors, whereas R = 58.1% was achieved with LaN/B_4C multilayers at the same wavelength. - Highlights: • Interface structure in B-based multilayer mirrors investigated. • Combining X-ray reflection, EUV reflection and transmission electron microscopy • Interface thickness and roughness asymmetry identified • Interface roughness increases with higher number of bilayers.

Design and development of the multilayer optics for the new hard x-ray mission

Science.gov (United States)

Pareschi, G.; Basso, S.; Citterio, O.; Spiga, D.; Tagliaferri, G.; Civitani, M.; Raimondi, L.; Sironi, G.; Cotroneo, V.; Negri, B.; Parodi, Giancarlo; Martelli, F.; Borghi, G.; Orlandi, A.; Vernani, D.; Valsecchi, G.; Binda, R.; Romaine, S.; Gorenstein, P.; Attinà, P.

2017-11-01

The New Hard X-ray Mission (NHXM) project will be operated by 2017 and is currently undergoing a Phase B study, under the coordination of the Italian Space Agency (ASI). The project is being proposed by an international team in the context of the ESA Call CV M3 as a Small Mission program, with a large Italian participation. It is based on 4 hard X-ray optics modules, each formed by 60 evenly spaced multilayer coated Wolter I mirror shells. An extensible bench is used to reach the 10 m focal length. The Wolter I monolithic substrates with multilayer coating are produced in NiCo by electroforming replication. Three of the mirror modules will host in the focal plane a hybrid a detector system (a soft X-ray Si DEPFET array plus a high energy CdTe detector). The detector of the fourth telescope will be a photoelectric polarimeter with imaging capabilities, operating from 2 up to 35 keV. The total on axis effective area of the three telescopes at 1 keV and 30 kev is of 1500 cm2 and 350 cm2 respectively, with an angular resolution of 20 arcsec HEW at 30 keV. In this paper we report on the design and development of the multilayer coated X-ray mirrors based on NiCo shells.

Transmission X-ray mirror

International Nuclear Information System (INIS)

Lairson, B.M.; Bilderback, D.H.

1982-01-01

Transmission X-ray mirrors have been made from 400 A to 10 000 A thick soap films and have been shown to have novel properties. Using grazing angles of incidence, low energy X-rays were reflected from the front surface while more energetic X-rays were transmitted through the mirror largely unattenuated. A wide bandpass monochromator was made from a silicon carbide mirror followed by a soap film transmission mirror and operated in the white beam at the cornell High Energy Synchrotron Source (CHESS). Bandpasses of ΔE/E=12% to 18% were achieved at 13 keV with peak efficiencies estimated to be between 55% and 75%, respectively. Several wide angle scattering photographs of stretched polyethylene and a phospholipid were obtained in 10 s using an 18% bandpass. (orig.)

Optimization of graded multilayer designs for astronomical x-ray telescopes

DEFF Research Database (Denmark)

Mao, P.H.; Harrison, F.A.; Windt, D.L.

1999-01-01

We developed a systematic method for optimizing the design of depth-graded multilayers for astronomical hard-x-ray and soft-gamma-ray telescopes based on the instrument's bandpass and the field of view. We apply these methods to the design of the conical-approximation Wolter I optics employed...... by the balloon-borne High Energy Focusing Telescope, using W/Si as the multilayer materials. In addition, we present optimized performance calculations of mirrors, using other material pairs that are capable of extending performance to photon energies above the W K-absorption edge (69.5 keV), including Pt/C, Ni...

A Magnetron Sputter Deposition System for the Development of X-Ray Multilayer Optics

Science.gov (United States)

Broadway, David

2015-01-01

The project objective is to establish the capability to deposit multilayer structures for x-ray, neutron, and extreme ultraviolet (EUV) optic applications through the development of a magnetron sputtering deposition system. A specific goal of this endeavor is to combine multilayer deposition technology with the replication process in order to enhance NASA Marshall Space Flight Center's (MSFC's) position as a world leader in the design of innovative x-ray instrumentation through the development of full shell replicated multilayer optics. The development of multilayer structures are absolutely necessary in order to advance the field of x-ray astronomy by pushing the limit for observing the universe to ever-increasing photon energies (i.e., up to 200 keV or higher), well beyond Chandra's (approx.10 keV) and NuStar's (approx.75 keV) capability. The addition of multilayer technology would significantly enhance the x-ray optics capability at MSFC and allow NASA to maintain its world leadership position in the development, fabrication, and design of innovative x-ray instrumentation, which would be the first of its kind by combining multilayer technology with the mirror replication process. This marriage of these technologies would allow astronomers to see the universe in a new light by pushing to higher energies that are out of reach with today's instruments. To this aim, a magnetron vacuum sputter deposition system for the deposition of novel multilayer thin film x-ray optics is proposed. A significant secondary use of the vacuum deposition system includes the capability to fabricate multilayers for applications in the field of EUV optics for solar physics, neutron optics, and x-ray optics for a broad range of applications including medical imaging.

A Magnetron Sputter Deposition System for the Development of Multilayer X-Ray Optics

Science.gov (United States)

Broadway, David; Ramsey, Brian; Gubarev, Mikhail

2014-01-01

The proposal objective is to establish the capability to deposit multilayer structures for x-ray, neutron, and EUV optic applications through the development of a magnetron sputtering deposition system. A specific goal of this endeavor is to combine multilayer deposition technology with the replication process in order to enhance the MSFC's position as a world leader in the design of innovative X-ray instrumentation through the development of full shell replicated multilayer optics. The development of multilayer structures is absolutely necessary in order to advance the field of X-ray astronomy by pushing the limit for observing the universe to ever increasing photon energies (i. e. up to 200 keV or higher); well beyond Chandra (approx. 10 keV) and NuStar's (approx. 75 keV) capability. The addition of multilayer technology would significantly enhance the X-ray optics capability at MSFC and allow NASA to maintain its world leadership position in the development, fabrication and design of innovative X-ray instrumentation which would be the first of its kind by combining multilayer technology with the mirror replication process. This marriage of these technologies would allow astronomers to see the universe in a new light by pushing to higher energies that are out of reach with today's instruments.To this aim, a magnetron vacum sputter deposition system for the deposition of novel multilayer thin film X-ray optics is proposed. A significant secondary use of the vacuum deposition system includes the capability to fabricate multilayers for applications in the field of EUV optics for solar physics, neutron optics, and X-ray optics for a broad range of applications including medical imaging.

Soft-x-ray fluorescence study of buried silicides in antiferromagnetically coupled Fe/Si multilayers

Energy Technology Data Exchange (ETDEWEB)

Carlisle, J.A.; Chaiken, A.; Michel, R.P. [Lawrence Berkeley National Lab., CA (United States)] [and others

1997-04-01

Multilayer films made by alternate deposition of two materials play an important role in electronic and optical devices such as quantum-well lasers and x-ray mirrors. In addition, novel phenomena like giant magnetoresistance and dimensional crossover in superconductors have emerged from studies of multilayers. While sophisticated x-ray techniques are widely used to study the morphology of multilayer films, progress in studying the electronic structure has been slower. The short mean-free path of low-energy electrons severely limits the usefulness of photoemission and related electron free path of low-energy electrons severely limit spectroscopies for multilayer studies. Soft x-ray fluorescence (SXF) is a bulk-sensitive photon-in, photon-out method to study valence band electronic states. Near-edge x-ray absorption fine-structure spectroscopy (NEXAFS) measured with partial photon yield can give complementary bulk-sensitive information about unoccupied states. Both these methods are element-specific since the incident x-ray photons excite electrons from core levels. By combining NEXAFS and SXF measurements on buried layers in multilayers and comparing these spectra to data on appropriate reference compounds, it is possible to obtain a detailed picture of the electronic structure. Results are presented for a study of a Fe/Si multilayer system.

Soft-x-ray fluorescence study of buried silicides in antiferromagnetically coupled Fe/Si multilayers

International Nuclear Information System (INIS)

Carlisle, J.A.; Chaiken, A.; Michel, R.P.

1997-01-01

Multilayer films made by alternate deposition of two materials play an important role in electronic and optical devices such as quantum-well lasers and x-ray mirrors. In addition, novel phenomena like giant magnetoresistance and dimensional crossover in superconductors have emerged from studies of multilayers. While sophisticated x-ray techniques are widely used to study the morphology of multilayer films, progress in studying the electronic structure has been slower. The short mean-free path of low-energy electrons severely limits the usefulness of photoemission and related electron free path of low-energy electrons severely limit spectroscopies for multilayer studies. Soft x-ray fluorescence (SXF) is a bulk-sensitive photon-in, photon-out method to study valence band electronic states. Near-edge x-ray absorption fine-structure spectroscopy (NEXAFS) measured with partial photon yield can give complementary bulk-sensitive information about unoccupied states. Both these methods are element-specific since the incident x-ray photons excite electrons from core levels. By combining NEXAFS and SXF measurements on buried layers in multilayers and comparing these spectra to data on appropriate reference compounds, it is possible to obtain a detailed picture of the electronic structure. Results are presented for a study of a Fe/Si multilayer system

The development for small scale soft X-ray spectrometer

International Nuclear Information System (INIS)

Sun Kexu; Jiang Shaoen; Yi Rongqing; Cui Yanli

2004-12-01

For the development of small-scale soft X-ray spectrometer, first, some small-scale soft X-ray detection elements are developed, it is included GaAs irradiated with neutron, GaAs irradiated with proton, multi-layer mirror, plane mirror and small scale X-ray diode et al. Soft X-ray spectrometers built of multi-layer mirror-GaAs (with neutron irradiation), and plane mirror-small-scale XRD, and plane mirror-GaAs (with proton irradiation) are prepared. These spectrometers are examined in Shen Guang-II laser facility, and some external estimation are given. (authors)

X-ray microscope with a Wolter mirror

International Nuclear Information System (INIS)

Watanabe, Norio; Aoki, Sadao

2003-01-01

A Wolter mirror as an objective of an X-ray microscope is described. In comparison with other optical elements, a Wolter mirror has several advantages, such as a large numerical aperture and no chromatic aberration. Recent developments of fabrication process enabled us to make a Wolter mirror objective for X-rays. The fabrication process and the applications to a soft X-ray microscope and an X-ray fluorescence microscope are described. (author)

Ultra-short period X-ray mirrors: Production and investigation

International Nuclear Information System (INIS)

Bibishkin, M.S.; Chkhalo, N.I.; Fraerman, A.A.; Pestov, A.E.; Prokhorov, K.A.; Salashchenko, N.N.; Vainer, Yu.A.

2005-01-01

Technological problems that deal with manufacturing of highly effective ultra-short (d=0.7-3.2 nm) period X-ray multilayer mirrors (MLM) are discussed in the article. In an example of Cr/Sc and W/B 4 C MLM it is experimentally shown, that the problem of periodicity and selectivity for multilayer dispersive X-ray elements has been generally solved by now. However, the problem of short-period MLM reflectivity increase related to existing of transitive borders between layers in structures remains rather urgent. The new technique of tungsten deposition using the RF source in order to decrease roughness in borders is discussed and tested. The results of measurements on wavelengths of 0.154, 0.834 and 1.759 nm are given. The RbAP crystals ordinary used in experiments and short-period W/B 4 C MLM produced are compared. The specular and non-specular characteristics of scattering on the 0.154 nm wavelengths are also measured in order to study transitive borders structures

X-ray scattering measurements from thin-foil x-ray mirrors

DEFF Research Database (Denmark)

Christensen, Finn Erland; BYRNAK, BP; Hornstrup, Allan

1992-01-01

Thin foil X-ray mirrors are to be used as the reflecting elements in the telescopes of the X-ray satellites Spectrum-X-Gamma (SRG) and ASTRO-D. High resolution X-ray scattering measurements from the Au coated and dip-lacquered Al foils are presented. These were obtained from SRG mirrors positioned...... in a test quadrant of the telescope structure and from ASTRO-D foils held in a simple fixture. The X-ray data is compared with laser data and other surface structure data such as STM, atomic force microscopy (AFM), TEM, and electron micrography. The data obtained at Cu K-alpha(1), (8.05 keV) from all...

Uniformity of the soft-x-ray emissions from gold foils irradiated by OMEGA laser beams determined by a two-mirror normal-incidence microscope with multilayer coatings

International Nuclear Information System (INIS)

Seely, John F.; Boehly, Thomas; Pien, Gregory; Bradley, David

1998-01-01

A two-mirror normal-incidence microscope with multilayer coatings was used to image the soft-x-ray emissions from planar foils irradiated by OMEGA laser beams. The bandpass of the multilayer coatings was centered at a wavelength of 48.3 Angstrom (257-eV energy) and was 0.5 Angstrom wide. Five overlapping OMEGA beams, without beam smoothing, were typically incident on the gold foils. The total energy was 1500 J, and the focused intensity was 6x10 13 Wcm -2 . The 5.8x magnified images were recorded by a gated framing camera at various times during the 3-ns laser pulse. A pinhole camera imaged the x-ray emission in the energy range of >2 keV. On a spatial scale of 10 μm, it was found that the soft-x-ray images at 257 eV were quite uniform and featureless. In contrast, the hard-x-ray images in the energy range of >2 kev were highly nonuniform with numerous features of size 150 μm. copyright 1998 Optical Society of America

Development and production of a multilayer-coated x-ray reflecting stack for the Athena mission

Science.gov (United States)

Massahi, S.; Ferreira, D. D. M.; Christensen, F. E.; Shortt, B.; Girou, D. A.; Collon, M.; Landgraf, B.; Barriere, N.; Krumrey, M.; Cibik, L.; Schreiber, S.

2016-07-01

The Advanced Telescope for High-Energy Astrophysics, Athena, selected as the European Space Agency's second large-mission, is based on the novel Silicon Pore Optics X-ray mirror technology. DTU Space has been working for several years on the development of multilayer coatings on the Silicon Pore Optics in an effort to optimize the throughput of the Athena optics. A linearly graded Ir/B4C multilayer has been deposited on the mirrors, via the direct current magnetron sputtering technique, at DTU Space. This specific multilayer, has through simulations, been demonstrated to produce the highest reflectivity at 6 keV, which is a goal for the scientific objectives of the mission. A critical aspect of the coating process concerns the use of photolithography techniques upon which we will present the most recent developments in particular related to the cleanliness of the plates. Experiments regarding the lift-off and stacking of the mirrors have been performed and the results obtained will be presented. Furthermore, characterization of the deposited thin-films was performed with X-ray reflectometry at DTU Space and in the laboratory of the Physikalisch-Technische Bundesanstalt at the synchrotron radiation facility BESSY II.

X-ray imaging with toroidal mirror

International Nuclear Information System (INIS)

Aoki, Sadao; Sakayanagi, Yoshimi

1978-01-01

X-ray imaging is made with a single toroidal mirror or two successive toroidal mirrors. Geometrical images at the Gaussian image plane are described by the ray trace. Application of a single toroidal mirror to small-angle scattering is presented. (author)

X-ray Multilayers and Thin-Shell Substrate Surface-Figure Correction

Science.gov (United States)

Windt, David

We propose a comprehensive experimental research program whose two main goals are (a) to improve the performance of hard X-ray multilayer coatings and (b) to develop a high-throughput method to correct mid-frequency surface errors in thin-shell mirror substrates. Achieving these goals will enable the cost-effective construction of light- weight, highly-nested X-ray telescopes having greater observational sensitivity, wider energy coverage, and higher angular resolution than can be achieved at present. The realization of this technology will thus benefit the development of a variety of Explorer- class NASA X-ray astronomy missions now being formulated for both the soft and hard X-ray bands, and will enable the construction of future facility-class X-ray missions that will require both high sensitivity and high resolution. Building on the success of our previous APRA-funded research, we plan to investigate new thin-film growth techniques, new materials, and new aperiodic coating designs in order to develop new hard X-ray multilayers that have higher X-ray reflectance, wider energy response, lower film stress, and good stability, and that can be produced more quickly, at reduced cost. Additionally, we propose to build upon our extensive experience in sub-nm film-thickness control using velocity modulation and masked deposition techniques, and in the recent development of low-roughness, low-stress films grown by reactive sputtering, in order to develop new methods for correcting mid-frequency surface errors in thin-shell mirror substrates using both differential deposition and ion-beam figuring, either alone or in combination. These two surface-correction techniques already being used for sub-nm figuring of precision optics in a variety of disciplines, including diffraction-limited EUV lithography and synchrotron applications requiring sub-micron focusing are ideally suited for controlling mm-scale surface errors in the thin-shell substrates used for astronomical X-ray

Soft X-ray imaging of thick carbon-based materials using the normal incidence multilayer optics.

Science.gov (United States)

Artyukov, I A; Feschenko, R M; Vinogradov, A V; Bugayev, Ye A; Devizenko, O Y; Kondratenko, V V; Kasyanov, Yu S; Hatano, T; Yamamoto, M; Saveliev, S V

2010-10-01

The high transparency of carbon-containing materials in the spectral region of "carbon window" (lambda approximately 4.5-5nm) introduces new opportunities for various soft X-ray microscopy applications. The development of efficient multilayer coated X-ray optics operating at the wavelengths of about 4.5nm has stimulated a series of our imaging experiments to study thick biological and synthetic objects. Our experimental set-up consisted of a laser plasma X-ray source generated with the 2nd harmonics of Nd-glass laser, scandium-based thin-film filters, Co/C multilayer mirror and X-ray film UF-4. All soft X-ray images were produced with a single nanosecond exposure and demonstrated appropriate absorption contrast and detector-limited spatial resolution. A special attention was paid to the 3D imaging of thick low-density foam materials to be used in design of laser fusion targets.

Ultra-short-period WC/SiC multilayer coatings for x-ray applications

International Nuclear Information System (INIS)

Fernández-Perea, Mónica; Pivovaroff, Mike J.; Soufli, Regina; Alameda, Jennifer; Mirkarimi, Paul; Descalle, Marie-Anne; Baker, Sherry L.; McCarville, Tom; Ziock, Klaus; Hornback, Donald; Romaine, Suzanne; Bruni, Ric; Zhong, Zhong; Honkimäki, Veijo; Ziegler, Eric; Christensen, Finn E.; Jakobsen, Anders C.

2013-01-01

Multilayer coatings enhance x-ray mirror performance at incidence angles steeper than the critical angle, allowing for improved flux, design flexibility and facilitating alignment. In an attempt to extend the use of multilayer coatings to photon energies higher than previously achieved, we have developed multilayers with ultra-short periods between 1 and 2 nm based on the material system WC/SiC. This material system was selected because it possesses very sharp and stable interfaces. In this article, we show highlights from a series of experiments performed in order to characterize the stress, microstructure and morphology of the multilayer films, as well as their reflective performance at photon energies from 8 to 384 keV

Design and fabrication of soft x-ray mirrors

Energy Technology Data Exchange (ETDEWEB)

Kawata, Masaru; Sasai, Hiroyuki; Sano, Kazuo [Shimadzu Corp., Production Engineering Laboratory, Kyoto (Japan)

2000-03-01

Soft x-ray photoelectron spectroscopic technology is important for measuring the chemical status of material surface in the LSI manufacturing process. We report on non-spherical mirrors focusing laser-induced plasma soft x-ray to fine sample surface. We designed toric and ellipsoidal mirror as soft x-ray condensing means, simulated focusing image, manufactured mirror surface on fused quartz substrate, and measured form accuracy. (author)

Development of multilayer optics for X-ray broadband spectrometry of plasma emission

International Nuclear Information System (INIS)

Emprin, Benoit

2014-01-01

Within the framework of the research on inertial confinement fusion, the 'Commissariat a l'energie atomique et aux energies alternatives' has studied and implemented an absolute calibrated time-Resolved broadband soft x-Ray spectrometer, called 'Diagnostic de Mesure du rayonnement X'. This diagnostic, composed of 20 measurement channels, measures the emitted radiant power from a laser created plasma in the range from 50 eV to 20 keV. We have developed additional measurement channels to obtain redundancy and an improvement in measurement accuracy. The principle of these new channels is based on an original concept to obtain spectral bounded flat-Responses. Two channels have been developed for the 2 - 4 keV and 4 - 6 keV spectral ranges, using aperiodic multilayer mirrors made at the 'Laboratoire Charles Fabry' with Cr/Sc and Ni/W/SiC/W layers respectively. These mirrors were characterized at synchrotron radiation facilities and integrated into the spectrometer. The two new channels were used during laser-Plasma experimental campaigns at the OMEGA laser facility in Rochester (USA). This allowed us to determine directly the radiant power with only one measurement within a certain spectral band, and with a better precision when compared with using standard channels. The results, in good agreement with the standard measurement channels, allowed us to validate the use of aperiodic multilayer mirrors for X-Ray broadband spectrometry. (author) [fr

Soft X-ray multilayers and filters

CERN Document Server

Wang Zhan Shan; Tang Wei Xing; Qin Shuji; Zhou Bing; Chen Ling Ya

2002-01-01

The periodic and non-periodic multilayers were designed by using a random number to change each layer and a suitable merit function. Ion beam sputtering and magnetron sputtering were used to fabricate various multilayers and beam splitters in soft X-ray range. The characterization of multilayers by small angle X-ray diffraction, Auger electron spectroscopy, Rutherford back scattering spectroscopy and reflectivity illustrated the multilayers had good structures and smooth interlayers. The reflectivity and transmission of a beam splitter is about 5%. The fabrication and transmission properties of Ag, Zr were studied. The Rutherford back scattering spectroscopy and auger electron spectroscopy were used to investigate the contents and distributions of impurities and influence on qualities of filters. The attenuation coefficients were corrected by the data obtained by measurements

Easily exchangeable x-ray mirrors and hybrid monochromator modules a study of their performance

Energy Technology Data Exchange (ETDEWEB)

Lin, Fan. [Philips Analytical, Asia Pacific, Toa Payoh, (Singapore); Kogan, V. [Philips Analytical, EA Almelo, (Netherlands); Saito, K. [Philips Analytical, Tokyo, (Japan)

1999-12-01

Full text: PreFix prealigned optical mounts allowing rapid and easily changeover will be presented. The benefits of laterally graded multilayer X-Ray mirrors coupled with these Prefix mounts - conversion of divergent beam to parallel beam, increase of intensity by a factor of 3-7, monochromation to {alpha}1 and {alpha}2 and a dynamic range of 10 {sup 4-5} CpS will be demonstrated in areas such as Thin Film and Powder analysis. Data will be shown on a diffraction profile of thin film (Cr/SiO{sub 2}) with and without a mirror and Si powder with and without a mirror. Further enhancement will be demonstrated by combining a channel cut monochromator-collimator with an X-Ray mirror to produce a high intensity, parallel, pure Cu K{alpha}1 beam with a high intensity of up to 4.5 x 10{sup 8} cps and a divergence down to 0.01 deg. The applicability to various ranging from High Resolution to thin film/reflectivity to Rietveld structural refinement and to phase analysis will be shown. The Rocking curve of HEMT 10nm InGaAs on InP will be presented using various `standard` optics and hybrid optics, also Si powder and a Rietveld refinement of CuS0{sub 4}.5H{sub 2}0 and Aspirin. A comparison of the benefits and application of X-Ray Mirrors and Hybrid Mirror/Monochromators will be given. The data presented will show that by using X-Ray Mirrors and Hybrid modules the performance of standard `Laboratory` Diffractometers can be greatly enhanced to a level previously unachievable with great practical benefits. Copyright (1999) Australian X-ray Analytical Association Inc.

Refractive optics to compensate x-ray mirror shape-errors

Science.gov (United States)

Laundy, David; Sawhney, Kawal; Dhamgaye, Vishal; Pape, Ian

2017-08-01

Elliptically profiled mirrors operating at glancing angle are frequently used at X-ray synchrotron sources to focus X-rays into sub-micrometer sized spots. Mirror figure error, defined as the height difference function between the actual mirror surface and the ideal elliptical profile, causes a perturbation of the X-ray wavefront for X- rays reflecting from the mirror. This perturbation, when propagated to the focal plane results in an increase in the size of the focused beam. At Diamond Light Source we are developing refractive optics that can be used to locally cancel out the wavefront distortion caused by figure error from nano-focusing elliptical mirrors. These optics could be used to correct existing optical components on synchrotron radiation beamlines in order to give focused X-ray beam sizes approaching the theoretical diffraction limit. We present our latest results showing measurement of the X-ray wavefront error after reflection from X-ray mirrors and the translation of the measured wavefront into a design for refractive optical elements for correction of the X-ray wavefront. We show measurement of the focused beam with and without the corrective optics inserted showing reduction in the size of the focus resulting from the correction to the wavefront.

Prototyping iridium coated mirrors for x-ray astronomy

Science.gov (United States)

Döhring, Thorsten; Probst, Anne-Catherine; Stollenwerk, Manfred; Emmerich, Florian; Stehlíková, Veronika; Inneman, Adolf

2017-05-01

X-ray astronomy uses space-based telescopes to overcome the disturbing absorption of the Earth's atmosphere. The telescope mirrors are operating at grazing incidence angles and are coated with thin metal films of high-Z materials to get sufficient reflectivity for the high-energy radiation to be observed. In addition the optical payload needs to be light-weighted for launcher mass constrains. Within the project JEUMICO, an acronym for "Joint European Mirror Competence", the Aschaffenburg University of Applied Sciences and the Czech Technical University in Prague started a collaboration to develop mirrors for X-ray telescopes. The X-ray telescopes currently developed within this Bavarian- Czech project are of Lobster eye type optical design. Corresponding mirror segments use substrates of flat silicon wafers which are coated with thin iridium films, as this material is promising high reflectivity in the X-ray range of interest. The deposition of the iridium films is based on a magnetron sputtering process. Sputtering with different parameters, especially by variation of the argon gas pressure, leads to iridium films with different properties. In addition to investigations of the uncoated mirror substrates the achieved surface roughness has been studied. Occasional delamination of the iridium films due to high stress levels is prevented by chromium sublayers. Thereby the sputtering parameters are optimized in the context of the expected reflectivity of the coated X-ray mirrors. In near future measurements of the assembled mirror modules optical performances are planned at an X-ray test facility.

Multilayer optics for monochromatic high-resolution X-ray imaging diagnostic in a broad photon energy range from 2 keV to 22 keV

International Nuclear Information System (INIS)

Troussel, Ph.; Dennetiere, D.; Maroni, R.; Høghøj, P.; Hedacq, S.; Cibik, L.; Krumrey, M.

2014-01-01

The “Commissariat à l’énergie atomique et aux énergies alternatives” (CEA) studies and designs advanced X-ray diagnostics to probe dense plasmas produced at the future Laser MegaJoule (LMJ) facility. Mainly for X-ray imaging with high spatial resolution, different types of multilayer mirrors were developed to provide broadband X-ray reflectance at grazing incidence. These coatings are deposited on two toroidal mirror substrates that are then mounted into a Wolter-type geometry (working at a grazing angle of 0.45°) to realize an X-ray microscope. Non-periodic (depth graded) W/Si multilayer can be used in the broad photon energy range from 2 keV to 22 keV. A third flat mirror can be added for the spectral selection of the microscope. This mirror is coated with a Mo/Si multilayer for which the d-spacing varies in the longitudinal direction to satisfy the Bragg condition within the angular acceptance of the microscope and also to compensate the angular dispersion due to the field of the microscope. We present a study of such a so-called Göbel mirror which was optimized for photon energy of 10.35 keV. The three mirrors were coated using magnetron sputtering technology by Xenocs SA. The reflectance in the entire photon energy range was determined in the laboratory of the Physikalisch-Technische Bundesanstalt (PTB) at the synchrotron radiation facility BESSY II in Berlin

Multilayer optics for monochromatic high-resolution X-ray imaging diagnostic in a broad photon energy range from 2 keV to 22 keV

Energy Technology Data Exchange (ETDEWEB)

Troussel, Ph., E-mail: philippe.troussel@cea.fr [CEA, DAM, DIF, F-91297 Arpajon (France); Dennetiere, D. [Synchrotron Soleil, L’orme des Merisiers, 91190 Saint-Aubin (France); Maroni, R. [CEA, DAM, DIF, F-91297 Arpajon (France); Høghøj, P.; Hedacq, S. [Xenocs SA, 19, rue François Blumet, F-38360 Sassenage (France); Cibik, L.; Krumrey, M. [Physikalisch-Technische Bundesanstalt (PTB), Abbestr. 2-12, 10587 Berlin (Germany)

2014-12-11

The “Commissariat à l’énergie atomique et aux énergies alternatives” (CEA) studies and designs advanced X-ray diagnostics to probe dense plasmas produced at the future Laser MegaJoule (LMJ) facility. Mainly for X-ray imaging with high spatial resolution, different types of multilayer mirrors were developed to provide broadband X-ray reflectance at grazing incidence. These coatings are deposited on two toroidal mirror substrates that are then mounted into a Wolter-type geometry (working at a grazing angle of 0.45°) to realize an X-ray microscope. Non-periodic (depth graded) W/Si multilayer can be used in the broad photon energy range from 2 keV to 22 keV. A third flat mirror can be added for the spectral selection of the microscope. This mirror is coated with a Mo/Si multilayer for which the d-spacing varies in the longitudinal direction to satisfy the Bragg condition within the angular acceptance of the microscope and also to compensate the angular dispersion due to the field of the microscope. We present a study of such a so-called Göbel mirror which was optimized for photon energy of 10.35 keV. The three mirrors were coated using magnetron sputtering technology by Xenocs SA. The reflectance in the entire photon energy range was determined in the laboratory of the Physikalisch-Technische Bundesanstalt (PTB) at the synchrotron radiation facility BESSY II in Berlin.

Multilayer optics for monochromatic high-resolution X-ray imaging diagnostic in a broad photon energy range from 2 keV to 22 keV

Science.gov (United States)

Troussel, Ph.; Dennetiere, D.; Maroni, R.; Høghøj, P.; Hedacq, S.; Cibik, L.; Krumrey, M.

2014-12-01

The "Commissariat à l'énergie atomique et aux énergies alternatives" (CEA) studies and designs advanced X-ray diagnostics to probe dense plasmas produced at the future Laser MegaJoule (LMJ) facility. Mainly for X-ray imaging with high spatial resolution, different types of multilayer mirrors were developed to provide broadband X-ray reflectance at grazing incidence. These coatings are deposited on two toroidal mirror substrates that are then mounted into a Wolter-type geometry (working at a grazing angle of 0.45°) to realize an X-ray microscope. Non-periodic (depth graded) W/Si multilayer can be used in the broad photon energy range from 2 keV to 22 keV. A third flat mirror can be added for the spectral selection of the microscope. This mirror is coated with a Mo/Si multilayer for which the d-spacing varies in the longitudinal direction to satisfy the Bragg condition within the angular acceptance of the microscope and also to compensate the angular dispersion due to the field of the microscope. We present a study of such a so-called Göbel mirror which was optimized for photon energy of 10.35 keV. The three mirrors were coated using magnetron sputtering technology by Xenocs SA. The reflectance in the entire photon energy range was determined in the laboratory of the Physikalisch-Technische Bundesanstalt (PTB) at the synchrotron radiation facility BESSY II in Berlin.

X-ray microfocusing with off-axis ellipsoidal mirror

Energy Technology Data Exchange (ETDEWEB)

Yumoto, Hirokatsu, E-mail: yumoto@spring8.or.jp; Koyama, Takahisa [Japan Synchrotron Radiation Research Institute/SPring-8, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198 (Japan); Matsuyama, Satoshi; Yamauchi, Kazuto [Department of Precision Science and Technology, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871 (Japan); Kohmura, Yoshiki; Ishikawa, Tetsuya [RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5148 (Japan); Ohashi, Haruhiko [Japan Synchrotron Radiation Research Institute/SPring-8, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198 (Japan); RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5148 (Japan)

2016-07-27

High-precision ellipsoidal mirrors for two-dimensionally focusing X-rays to nanometer sizes have not been realized because of technical problems in their fabrication processes. The objective of the present study is to develop fabrication techniques for ellipsoidal focusing mirrors in the hard-X-ray region. We design an off-axis ellipsoidal mirror for use under total reflection conditions up to the X-ray energy of 8 keV. We fabricate an ellipsoidal mirror with a surface roughness of 0.3 nm RMS (root-mean-square) and a surface figure error height of 3.0 nm RMS by utilizing a surface profiler and surface finishing method developed by us. The focusing properties of the mirror are evaluated at the BL29XUL beamline in SPring-8. A focusing beam size of 270 nm × 360 nm FWHM (full width at half maximum) at an X-ray energy of 7 keV is observed with the use of the knife-edge scanning method. We expect to apply the developed fabrication techniques to construct ellipsoidal nanofocusing mirrors.

X-ray total reflection mirrors for coherent illumination

CERN Document Server

Ishikawa, T; Yabashi, M; Souvorov, A; Yamauchi, K; Yamamura, K; Mimura, H; Saito, A; Mori, Y

2002-01-01

X-ray mirrors for coherent illumination demand much higher surface quality than is achievable with the conventional polishing techniques. Plasma chemical vaporization machining (CVM) and elastic emission machining (EEM) have been applied for x-ray mirror manufacturing. Figure error of a flat silicon single crystal mirrors made with CVM+EEM process was reduced to 2.0 nm peak-to-valley and 0.2 nm RMS. The machining process was also applied to make elliptical mirrors. One-dimensional focusing with a single elliptical mirror showed diffraction-limited properties with the focal width of 200 nm. Two-dimensional focusing with Kirkpatric-Baez configuration gave a focal spot size of 200 nm x 200 nm. (author)

Enhanced brightness x-ray lasers

International Nuclear Information System (INIS)

Wan, A.S.; Cauble, R.C.; Da Silva, L.B.; Moreno, J.C.; Nilsen, J.

1994-09-01

We are developing short-pulsed, enhanced-brightness, and coherent x-ray lasers (XRLs) for applications in areas such as plasma imaging. In a traveling wave pump setup the optical laser creating the XRL plasma sweeps along the lasant axis at the same speed as the x-rays. This technique becomes increasingly important as the target length increases and the gain duration shortens. An order of magnitude increase in output energy was measured with vs without traveling wave pump. Using multiple pulse techniques and multilayer mirrors to inject the output of one pulse back into the plasma formed by a later pulse we have begun to develop the x-ray analog of a multi-pass amplifler. The use of multiple pulses separated by as much as 1.6 ns reduces multilayer mirror damage. This injection technique is demonstrated by imaging the near-field emission profiles of the XRL. The addition of multilayer beamsplitter will allow us to effectively produce a soft XRL cavity

X ray reflection masks: Manufacturing, characterization and first tests

Science.gov (United States)

Rahn, Stephen

1992-09-01

SXPL (Soft X-ray Projection Lithography) multilayer mirrors are characterized, laterally structured and then used as reflection masks in a projecting lithography procedure. Mo/Si-multilayer mirrors with a 2d in the region of 14 nm were characterized by Cu-k(alpha) grazing incidence as well as soft X-ray normal incidence reflectivity measurements. The multilayer mirrors were patterned by reactive ion etching with CF4 using a photoresist as etch mask, thus producing X-ray reflection masks. The masks were tested at the synchrotron radiation laboratory of the electron accelerator ELSA. A double crystal X-ray monochromator was modified so as to allow about 0.5 sq cm of the reflection mask to be illuminated by white synchrotron radiation. The reflected patterns were projected (with an energy of 100 eV) onto a resist and structure sizes down to 8 micrometers were nicely reproduced. Smaller structures were distorted by Fresnel-diffraction. The theoretically calculated diffraction images agree very well with the observed images.

Bonded Multilayer Laue Lens for focusing hard X-rays

International Nuclear Information System (INIS)

Liu Chian; Conley, R.; Qian, J.; Kewish, C.M.; Macrander, A.T.; Maser, J.; Kang, H.C.; Yan, H.; Stephenson, G.B.

2007-01-01

We have fabricated partial Multilayer Laue Lens (MLL) linear zone plate structures with thousands of alternating WSi 2 and Si layers and various outermost zone widths according to the Fresnel zone plate formula. Using partial MLL structures, we were able to focus hard X-rays to line foci with a width of 30 nm and below. Here, we describe challenges and approaches used to bond these multilayers to achieve line and point focusing. Bonding was done by coating two multilayers with AuSn and heating in a vacuum oven at 280-300 o C. X-ray reflectivity measurements confirmed that there was no change in the multilayers after heating to 350 o C. A bonded MLL was polished to a 5-25 μm wedge without cracking. SEM image analyses found well-positioned multilayers after bonding. These results demonstrate the feasibility of a bonded full MLL for focusing hard X-rays

Silicon Wafer X-ray Mirror

Data.gov (United States)

National Aeronautics and Space Administration — We propose to undertake the initial development of a Kirkpatrick-Baez (K-B) type X-ray mirror using the relatively recent availability of high quality, inexpensive,...

An experimental measurement of metal multilayer x-ray reflectivity degradation due to intense x-ray flux

International Nuclear Information System (INIS)

Hockaday, M.Y.P.

1987-06-01

The degradation of the x-ray reflection characteristics of metal multilayer Bragg diffractors due to intense x-ray flux was investigated. The Z-pinch plasma produced by PROTO II of Sandia National Laboratories, Albuquerque, New Mexico, was used as the source. The plasma generated total x-ray yields of as much as 40 kJ with up to 15 kJ in the neon hydrogen- and helium-like resonance lines in nominal 20-ns pulses. Molybdenum-carbon, palladium-carbon, and tungsten-carbon metal multilayers were placed at 15 and 150 cm from the plasma center. The multilayers were at nominal angles of 5 0 and 10 0 to diffract the neon resonance lines. The time-integrated x-ray reflection of the metal multilayers was monitored by x-ray film. A fluorescer-fiber optic-visible streak camera detector system was then used to monitor the time-resolved x-ray reflection characteristics of 135 A- 2d tungsten-carbon multilayers. A large specular component in the reflectivity prevented determination of the rocking curve of the multilayer. For a neon implosion onto a vanadium-doped polyacrylic acid foam target shot, detailed modeling was attempted. The spectral flux was determined with data from 5 XRD channels and deconvolved using the code SHAZAM. The observed decay in reflectivity was assumed to correspond to the melting of the first tungsten layer. A ''conduction factor'' of 82 was required to manipulate the heat loading of the first tungsten layer such that the time of melting corresponded to the observed decay. The power at destruction was 141 MW/cm 2 and the integrated energy at destruction was 2.0 J/cm 2 . 82 refs., 66 figs., 10 tabs

Degradation of periodic multilayers as seen by small-angle x-ray scattering and x-ray diffraction

CERN Document Server

Rafaja, D; Simek, D; Zdeborova, L; Valvoda, V

2002-01-01

The capabilities of small-angle x-ray scattering (SAXS) and wide-angle x-ray diffraction (XRD) to recognize structural changes in periodic multilayers were compared on Fe/Au multilayers with different degrees of structural degradation. Experimental results have shown that both methods are equally sensitive to the multilayer degradation, i.e., to the occurrence of non-continuous interfaces, to short-circuits in the multilayer structure and to the multilayer precipitation. XRD yielded additional information on the multilayer crystallinity, whilst SAXS could better recognize fragments of a long-range periodicity (remnants of the original multilayer structure). Changes in the multilayer structure were initiated by successive annealing at 200 and 300 deg. C. Experimental data were complemented by numerical simulations performed using a combination of optical theory and the distorted wave Born approximation for SAXS or the kinematical Born approximation for XRD.

Extended asymmetric-cut multilayer X-ray gratings.

Science.gov (United States)

Prasciolu, Mauro; Haase, Anton; Scholze, Frank; Chapman, Henry N; Bajt, Saša

2015-06-15

The fabrication and characterization of a large-area high-dispersion blazed grating for soft X-rays based on an asymmetric-cut multilayer structure is reported. An asymmetric-cut multilayer structure acts as a perfect blazed grating of high efficiency that exhibits a single diffracted order, as described by dynamical diffraction throughout the depth of the layered structure. The maximum number of grating periods created by cutting a multilayer deposited on a flat substrate is equal to the number of layers deposited, which limits the size of the grating. The size limitation was overcome by depositing the multilayer onto a substrate which itself is a coarse blazed grating and then polish it flat to reveal the uniformly spaced layers of the multilayer. The number of deposited layers required is such that the multilayer thickness exceeds the step height of the substrate structure. The method is demonstrated by fabricating a 27,060 line pairs per mm blazed grating (36.95 nm period) that is repeated every 3,200 periods by the 120-μm period substrate structure. This preparation technique also relaxes the requirements on stress control and interface roughness of the multilayer film. The dispersion and efficiency of the grating is demonstrated for soft X-rays of 13.2 nm wavelength.

EUV soft X-ray characterization of a FEL multilayer optics damaged by multiple shot laser beam

International Nuclear Information System (INIS)

Giglia, A.; Mahne, N.; Bianco, A.; Svetina, C.; Nannarone, S.

2011-01-01

We have investigated the damaging effects of a femtosecond pulsed laser beam with 400 nm wavelength on a Mo/Si EUV multilayer. The exposures have been done in vacuum with multiple pulses (5 pulses/mm 2 ) of 120 fs varying the laser fluence in the 38-195 mJ/cm 2 range. The analysis of the different irradiated regions has been performed ex-situ by means of different techniques, including specular and diffuse reflectivity, X-ray photoemission spectroscopy (XPS) and total electron yield (TEY) in the EUV and soft X-ray range. Surface images have been acquired by atomic force microscopy (AFM) and scanning electron microscopy (SEM). Results clearly indicate a progressive degradation of the EUV multilayer performances with the increase of the laser fluence. Spectroscopic analysis allowed to correlate the decrease of reflectivity with the degradation of the multilayer stacking, ascribed to Mo-Si intermixing at the Mo/Si interfaces of the first layers, close to the surface of the mirror.

X-ray microscopy using grazing-incidence reflections optics

International Nuclear Information System (INIS)

Price, R.H.

1983-01-01

The role of Kirkpatrick-Baez microscopes as the workhorse of the x-ray imaging devices is discussed. This role is being extended with the development of a 22X magnification Kirkpatrick-Baez x-ray microscope with multilayer x-ray mirrors. These mirrors can operate at large angles, high x-ray energies, and have a narrow, well defined x-ray energy bandpass. This will make them useful for numerous experiments. However, where a large solid angle is needed, the Woelter microscope will still be necessary and the technology needed to build them will be useful for many other types of x-ray optics

X-ray photographs of a solar active region with a multilayer telescope at normal incidence

Science.gov (United States)

Underwood, J. H.; Bruner, M. E.; Haisch, B. M.; Brown, W. A.; Acton, L. W.

1987-01-01

An astronomical photograph was obtained with a multilayer X-ray telescope. A 4-cm tungsten-carbon multilayer mirror was flown as part of an experimental solar rocket payload, and successful images were taken of the sun at normal incidence at a wavelength of 44 A. Coronal Si XII emission from an active region was recorded on film; as expected, the structure is very similar to that observed at O VIII wavelengths by the Solar Maximum Mission flat-crystal spectrometer at the same time. The small, simple optical system used in this experiment appears to have achieved a resolution of 5 to 10 arcsec.

X-ray instrumentation: monochromators and mirrors

International Nuclear Information System (INIS)

Rodrigues, A.R.D.

1983-01-01

The main type of X-ray monochromators used with Synchrotron Radiation are discussed in relation to the energy resolution and to the spectral contamination, as well special systems for applications which require simultaneously high flux and resolution. The characteristics for X-ray mirrors necessaries for its utilization with synchrotron radiation are also analized, as conformators of the beam geometry and spectrum. (L.C.) [pt

Hard X-ray nano-focusing with Montel mirror optics

Energy Technology Data Exchange (ETDEWEB)

Liu Wenjun, E-mail: wjliu@anl.gov [Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439 (United States); Ice, Gene E. [Oak Ridge National Laboratory, Oak Ridge, TN 37831 (United States); Assoufid, Lahsen; Liu Chian; Shi Bing; Zschack, Paul [Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439 (United States); Tischler, Jon [Oak Ridge National Laboratory, Oak Ridge, TN 37831 (United States); Qian Jun; Khachartryan, Ruben; Shu Deming [Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439 (United States)

2011-09-01

Kirkpatrick-Baez mirrors in the Montel (or nested) configuration were tested for hard X-ray nanoscale focusing at a third generation synchrotron beamline. In this scheme, two mirrors, mounted side-by-side and perpendicular to each other, provide for a more compact focusing system and a much higher demagnification and flux than the traditional sequential K-B mirror arrangement. They can accept up to a 120 {mu}mx120 {mu}m incident X-ray beam with a long working distance of 40 mm and broad-bandpass of energies up to {approx}30 keV. Initial test demonstrated a focal spot of about 150 nm in both horizontal and vertical directions with either polychromatic or monochromatic beam. Montel mirror optics is important and very appealing for achromatic X-ray nanoscale focusing in conventional non-extra-long synchrotron beamlines.

X-ray optics for scanning fluorescence microscopy and other applications

International Nuclear Information System (INIS)

Ryon, R.W.; Warburton, W.K.

1992-05-01

Scanning x-ray fluorescence microscopy is analogous to scanning electron microscopy. Maps of chemical element distribution are produced by scanning with a very small x-ray beam. Goal is to perform such scanning microscopy with resolution in the range of <1 to 10 μm, using standard laboratory x-ray tubes. We are investigating mirror optics in the Kirkpatrick-Baez (K-B) configuration. K-B optics uses two curved mirrors mounted orthogonally along the optical axis. The first mirror provides vertical focus, the second mirror provides horizontal focus. We have used two types of mirrors: synthetic multilayers and crystals. Multilayer mirrors are used with lower energy radiation such as Cu Kα. At higher energies such as Ag Kα, silicon wafers are used in order to increase the incidence angles and thereby the photon collection efficiency. In order to increase the surface area of multilayers which reflects x-rays at the Bragg angle, we have designed mirrors with the spacing between layers graded along the optic axis in order to compensate for the changing angle of incidence. Likewise, to achieve a large reflecting surface with silicon, the wafers are placed on a specially designed lever arm which is bent into a log spiral by applying force at one end. In this way, the same diffracting angle is maintained over the entire surface of the wafer, providing a large solid angle for photon collection

X-ray microscopy using grazing-incidence reflection optics

International Nuclear Information System (INIS)

Price, R.H.

1981-01-01

The Kirkpatrick-Baez microscopes are described along with their role as the workhorse of the x-ray imaging devices. This role is being extended with the development of a 22X magnification Kirkpatrick-Baez x-ray microscope with multilayer x-ray mirrors. These mirrors can operate at large angles, high x-ray energies, and have a narrow, well defined x-ray energy bandpass. This will make them useful for numerous experiments. However, where a large solid angle is needed, the Woelter microscope will still be necessary and the technology needed to build them will be useful for many other types of x-ray optics

High-resolution X-ray diffraction studies of multilayers

DEFF Research Database (Denmark)

Christensen, Finn Erland; Hornstrup, Allan; Schnopper, H. W.

1988-01-01

High-resolution X-ray diffraction studies of the perfection of state-of-the-art multilayers are presented. Data were obtained using a triple-axis perfect-crystal X-ray diffractometer. Measurements reveal large-scale figure errors in the substrate. A high-resolution triple-axis set up is required...

Silicon Wafer X-ray Mirror Project

Data.gov (United States)

National Aeronautics and Space Administration — We propose to undertake the initial development of a Kirkpatrick-Baez (K-B) type X-ray mirror using the relatively recent availability of high quality, inexpensive,...

Scanning tunneling microscopy studies of thin foil x-ray mirrors

DEFF Research Database (Denmark)

Christensen, Finn Erland; Besenbacher, Flemming; Garnaes, Jorgen

1990-01-01

In this paper scanning tunneling microscopy (STM) measurements of x-ray mirrors are presented. The x-ray mirrors are 0.3 mm thick dip-lacquered aluminum foils coated with gold by evaporation, as well as state-of-the-art polished surfaces coated with gold, platinum, or iridium. The measurements...

Development of iridium coated x-ray mirrors for astronomical applications

Science.gov (United States)

Döhring, Thorsten; Probst, Anne-Catherine; Emmerich, Florian; Stollenwerk, Manfred; Stehlíková, Veronika; Friedrich, Peter; Damm, Christine

2017-08-01

Future space-based X-ray observatories need to be very lightweight for launcher mass constraints. Therefore they will use a reduced mirror thickness, which results in the additional requirement of low coating stress to avoid deformation of the initial precisely shaped mirror substrates. Due to their excellent reflection properties iridium coatings are sometimes applied for grazing incidence mirrors in astronomical X-ray telescopes. At Aschaffenburg University of Applied Sciences the coating of thin iridium films by an RF-magnetron sputtering technique is under development. The work is embedded in collaborations with the Max-Planck-Institute for Extraterrestrial Physics in Germany, the Czech Technical University in Prague, the Osservatorio Astronomico di Brera in Italy, the German Leibniz Institute for Solid State and Materials Research in Dresden, and the French Institute Fresnel. Sputtering with different parameters leads to iridium films with different properties. The current work is focused on the microstructure of the iridium coatings to study the influence of the substrate and of the argon gas pressure on the thin film growing process. Correlations between coating density, surface micro-roughness, the crystalline structure of the iridium layers, and the expected reflectivity of the X-ray mirror as well as coating stress effects are presented and discussed. The final goal of the project is to integrate the produced prototype mirrors into an X-ray telescope module. On a longer timescale measurements of the mirror modules optical performance are planned at the X-ray test facility PANTER.

Monochromatic x-rays for low-dose digital mammography: preliminary results.

Science.gov (United States)

Yoon, Kwon-Ha; Kwon, Young Man; Choi, Byoung-Jung; Son, Hyun Hwa; Ryu, Cheol Woo; Chon, Kwon Su; Park, Seong Hoon; Juhng, Sun Kwan

2012-12-01

The feasibility of using monochromatic x-ray imaging generated from an x-ray tube and a multilayer reflector for digital mammography with a low radiation dose was examined. A multilayer mirror was designed to select the x-ray peak with an energy of 21.5 keV generated from an x-ray tube with a tungsten target and was fabricated by the ion-beam sputtering deposition system. Monochromatic x-ray images were obtained from an experimental digital mammography setup with a scanning stage. The performance of the system was evaluated using a breast phantom, a spectrometer, and a radiation dosimeter. We measured the contrast-to-noise ratio and performed the 10% modulation function test to determine image quality and resolution. The monochromatic beam from the multilayer reflector had a full-width-at-half-maximum of 0.9 keV at 21.5 keV, and the reflectivity was 0.70, which was 90% of the designed value. The polychromatic and monochromatic x-rays showed radiation doses of 0.497 and 0.0415 mGy, respectively. The monochromatic x-ray image shows fibers, calcifications, and masses more clearly than the polychromatic x-ray images do. The image contrast of the monochromatic x-rays was 1.85 times higher than that of the polychromatic x-rays. The experimental mammography setup had a spatial resolution of 7 lp/mm with both x-rays. Monochromatic x-rays generated using a multilayer mirror may be a useful diagnostic tool for breast examination by providing high contrast imaging with a low radiation dose.

Reconstruction of quasimonochromatic images for multispectral x-ray imaging with a pinhole array and a flat Bragg mirror

International Nuclear Information System (INIS)

Izumi, N.; Barbee, T. W.; Koch, J. A.; Mancini, R. C.; Welser, L. A.

2006-01-01

We have developed a software package for reconstruction of quasimonochromatic images from a multiple monochromatic x-ray imager for inertial confinement fusion implosions. The instrument consists of a pinhole array, a multilayer Bragg mirror, and an image detector. The pinhole array projects hundreds of images onto the detector after reflection off the multilayer Bragg mirror, which introduces spectral dispersion along the reflection axis. The quasimonochromatic images of line emissions and continuum emissions can be used for measurement of temperature and density maps of implosion plasmas. In this article, we describe a computer-aided processing technique for systematic reconstruction of quasimonochromatic images from raw data. This technique provides flexible spectral bandwidth selection and allows systematic subtraction of continuum emission from line emission images

The challenge of developing thin mirror shells for future x-ray telescopes

Science.gov (United States)

Döhring, Thorsten; Stollenwerk, Manfred; Gong, Qingqing; Proserpio, Laura; Winter, Anita; Friedrich, Peter

2015-09-01

Previously used mirror technologies are not able to fulfil the requirements of future X-ray telescopes due to challenging requests from the scientific community. Consequently new technical approaches for X-ray mirror production are under development. In Europe the technical baseline for the planned X-ray observatory ATHENA is the radical new approach of silicon pore optics. NASÁs recently launched NuSTAR mission uses segmented mirrors shells made from thin bended glasses, successfully demonstrating the feasibility of the glass forming technology for X-ray mirrors. For risk mitigation also in Europe the hot slumping of thin glasses is being developed as an alternative technology for lightweight X-ray telescopes. The high precision mirror manufacturing requires challenging technical developments; several design trades and trend-setting decisions need to be made and are discussed within this paper. Some new technical and economic aspects of the intended glass mirror serial production are also studied within the recently started interdisciplinary project INTRAAST, an acronym for "industry transfer of astronomical mirror technologies". The goal of the project, embedded in a cooperation of the Max-Planck-Institute for extraterrestrial Physics and the University of Applied Sciences Aschaffenburg, is to master the challenge of producing thin mirror shells for future X-ray telescopes. As a first project task the development of low stress coatings for thin glass mirror substrates have been started, the corresponding technical approach and first results are presented.

Thermal stress prediction in mirror and multilayer coatings.

Science.gov (United States)

Cheng, Xianchao; Zhang, Lin; Morawe, Christian; Sanchez Del Rio, Manuel

2015-03-01

Multilayer optics for X-rays typically consist of hundreds of periods of two types of alternating sub-layers which are coated on a silicon substrate. The thickness of the coating is well below 1 µm (tens or hundreds of nanometers). The high aspect ratio (∼10(7)) between the size of the optics and the thickness of the multilayer can lead to a huge number of elements (∼10(16)) for the numerical simulation (by finite-element analysis using ANSYS code). In this work, the finite-element model for thermal-structural analysis of multilayer optics has been implemented using the ANSYS layer-functioned elements. The number of meshed elements is considerably reduced and the number of sub-layers feasible for the present computers is increased significantly. Based on this technique, single-layer coated mirrors and multilayer monochromators cooled by water or liquid nitrogen are studied with typical parameters of heat-load, cooling and geometry. The effects of cooling-down of the optics and heating of the X-ray beam are described. It is shown that the influences from the coating on temperature and deformation are negligible. However, large stresses are induced in the layers due to the different thermal expansion coefficients between the layer and the substrate materials, which is the critical issue for the survival of the optics. This is particularly true for the liquid-nitrogen cooling condition. The material properties of thin multilayer films are applied in the simulation to predict the layer thermal stresses with more precision.

Fabrication, performance, and figure metrology of epoxy-replicated aluminum foils for hard x-ray focusing multilayer-coated segmented conical optics

DEFF Research Database (Denmark)

Jimenez-Garate, M.A.; Craig, W.W.; Hailey, C.J.

2000-01-01

We fabricated x-ray mirrors for hard x-ray (greater than or equal to 10 keV) telescopes using multilayer coatings and an improved epoxy-replicated aluminum foil (ERAF) nonvacuum technology. The ERAF optics have similar to1 arcmin axial figure half-power diameter (HPD) and passed environmental...... telescope HPD, we designed a figure metrology system and a new mounting technique. We describe a cylindrical metrology system built for fast axial and roundness figure measurement of hard x-ray conical optics. These developments lower cost and improve the optics performance of the HEFT (high-energy focusing...

Design of grazing-incidence multilayer supermirrors for hard-X-ray reflectors

DEFF Research Database (Denmark)

Joensen, K. D.; Voutov, P.; Szentgyorgyi, A.

1995-01-01

Extremely broadband grazing-incidence multilayers for hard-X-ray reflection can be obtained by a gradual change of the layer thicknesses down through the structure. Existing approaches for designing similar neutron optics, called supermirrors, are shown to provide respectable performance when...... applied to X-ray multilayers. However, none of these approaches consider the effects of imperfect layer interfaces and absorption in the overlying layers. Adaptations of neutron designs that take these effects into account are presented, and a thorough analysis of two specific applications (a single hard......-X-ray reflector and a hard-X-ray telescope) shows that an improved performance can be obtained. A multilayer whose bilayer thicknesses are given by a power law expression is found to provide the best solution; however, it is only slightly better than some of the adapted neutron designs...

Development of a multi-lane X-ray mirror providing variable beam sizes

Energy Technology Data Exchange (ETDEWEB)

Laundy, D., E-mail: david.laundy@diamond.ac.uk; Sawhney, K.; Nistea, I.; Alcock, S. G.; Pape, I.; Sutter, J.; Alianelli, L.; Evans, G. [Diamond Light Source Ltd., Harwell Science and Innovation Campus, Didcot OX11 0DE (United Kingdom)

2016-05-15

Grazing incidence mirrors are used on most X-ray synchrotron beamlines to focus, collimate or suppress harmonics. Increasingly beamline users are demanding variable beam shapes and sizes at the sample position. We have now developed a new concept to rapidly vary the beam size and shape of a focused X-ray beam. The surface of an elliptically figured mirror is divided into a number of laterally separated lanes, each of which is given an additional longitudinal height profile calculated to shape the X-ray beam to a top-hat profile in the focal plane. We have now fabricated two prototype mirrors and present the results of metrology tests and measurements made with one of the mirrors focusing the X-rays on a synchrotron beamline. We envisage that such mirrors could be widely applied to rapid beam-size switching on many synchrotron beamlines.

Probing buried solid-solid interfaces in magnetic multilayer structures and other nanostructures using spectroscopy excited by soft x-ray standing waves

International Nuclear Information System (INIS)

Yang, S.-H.; Mun, B.S.; Mannella, N.; Sell, B.; Ritchey, S.B.; Fadley, C.S.; Pham, L.; Nambu, A.; Watanabe, M.

2004-01-01

Full text: Buried solid-solid interfaces are becoming increasingly more important in all aspects of nanoscience, and we here dis- cuss the st applications of a new method for selectively studying them with the vuv/soft x-ray spectroscopies. As specific examples, magnetic multilayer structures represent key elements of current developments in spintronics, including giant magnetoresistance, exchange bias, and magnetic tunnel resistance. The buried interfaces in such structures are of key importance to their performance, but have up to now been difficult to study selectively with these spectroscopies. This novel method involves excitation of photoelectrons or fluorescent x-rays with soft x-ray standing waves created by Bragg reflection from a multilayer mirror substrate on which the sample is grown. We will discuss core and valence photoemission, as well soft x-ray emission, results from applying this method to multilayer structures relevant to both giant magnetoresistance (Fe/Cr-[2]) and magnetic tunnel junctions (Al 2 O 3 /FeCo) , including magnetic dichroism measurements. Work supported by the Director, Of e of Science, Of e of Basic Energy Sciences, Materials Science and Engineering Division, U.S. Department of Energy, Contract No. DE-AC03-76SF000

Soft-X-Ray Projection Lithography Using a High-Repetition-Rate Laser-Induced X-Ray Source for Sub-100 Nanometer Lithography Processes

NARCIS (Netherlands)

E. Louis,; F. Bijkerk,; Shmaenok, L.; Voorma, H. J.; van der Wiel, M. J.; Schlatmann, R.; Verhoeven, J.; van der Drift, E. W. J. M.; Romijn, J.; Rousseeuw, B. A. C.; Voss, F.; Desor, R.; Nikolaus, B.

1993-01-01

In this paper we present the status of a joint development programme on soft x-ray projection lithography (SXPL) integrating work on high brightness laser plasma sources. fabrication of multilayer x-ray mirrors. and patterning of reflection masks. We are in the process of optimization of a

X-ray active mirror coupled with a Hartmann wavefront sensor

International Nuclear Information System (INIS)

Idir, Mourad; Mercere, Pascal; Modi, Mohammed H.; Dovillaire, Guillaume; Levecq, Xavier; Bucourt, Samuel; Escolano, Lionel; Sauvageot, Paul

2010-01-01

This paper reports on the design and performances of a test prototype active X-ray mirror (AXM) which has been designed and manufactured in collaboration with the French Small and Medium Enterprise mechanical company ISP System for the national French storage ring SOLEIL. Coupled with this active X-ray mirror and also in collaboration with another French Small and Medium Enterprise (Imagine Optic) a lot of efforts have been done in order to design and fabricate a wavefront X-ray analyzer based on the Hartmann principle (Hartman wavefront sensor, HWS).

High Reflectance Nanoscale V/Sc Multilayer for Soft X-ray Water Window Region.

Science.gov (United States)

Huang, Qiushi; Yi, Qiang; Cao, Zhaodong; Qi, Runze; Loch, Rolf A; Jonnard, Philippe; Wu, Meiyi; Giglia, Angelo; Li, Wenbin; Louis, Eric; Bijkerk, Fred; Zhang, Zhong; Wang, Zhanshan

2017-10-10

V/Sc multilayer is experimentally demonstrated for the first time as a high reflectance mirror for the soft X-ray water window region. It primarily works at above the Sc-L edge (λ = 3.11 nm) under near normal incidence while a second peak appears at above the V-L edge (λ = 2.42 nm) under grazing incidence. The V/Sc multilayer fabricated with a d-spacing of 1.59 nm and 30 bilayers has a smaller interface width (σ = 0.27 and 0.32 nm) than the conventional used Cr/Sc (σ = 0.28 and 0.47 nm). For V/Sc multilayer with 30 bilayers, the introduction of B 4 C barrier layers has little improvement on the interface structure. As the number of bilayers increasing to 400, the growth morphology and microstructure of the V/Sc layers evolves with slightly increased crystallization. Nevertheless, the surface roughness remains to be 0.25 nm. A maximum soft X-ray reflectance of 18.4% is measured at λ = 3.129 nm at 9° off-normal incidence using the 400-bilayers V/Sc multilayer. According to the fitted model, an s-polarization reflectance of 5.2% can also be expected at λ = 2.425 nm under 40° incidence. Based on the promising experimental results, further improvement of the reflectance can be achieved by using a more stable deposition system, exploring different interface engineering methods and so on.

Development of soft x-ray optical elements at the advanced photon research center

International Nuclear Information System (INIS)

Ishino, Masahiko; Yoda, Osamu; Koike, Masato; Sano, Kazuo; Iwasaki, Hiroshi

2003-01-01

We have been developing soft X-ray optical elements such as diffraction gratings and multilayer mirrors to applied to X-ray plasma sources and X-ray lasers and so on. In the field of the development of diffraction gratings, the laminar-type holographic gratings for flat-field spectrographs were found to be very effective in suppressing the higher orders and stray-light level. The fabricated holographic grating has a comparable spectral resolution to the replica commercial grating. In the development of the soft X-ray multilayer mirrors, the improvement of the heat stability of the Mo/Si multilayer was carried out. We have found that the Mo/SiO 2 /Si/SiO 2 multilayer having the SiO 2 layer thicknesses of 0.5 nm at the Si-on-Mo interface and of 1.5 nm at the Mo-on-Si interface has thermally stable structure up to 500degC and maintains high soft X-ray reflectivity after annealing at 400degC. In addition, we have developed an evaluation system capable of measuring the wavelength and angular characteristics of the reflectivity and diffraction efficiency of soft X-ray optical elements. (author)

X-ray generation by femtosecond laser pulses and its application to soft X-ray imaging microscope

International Nuclear Information System (INIS)

Ikeda, Kenichi; Kotaki, Hideyuki; Nakajima, Kazuhisa

2002-01-01

We have developed laser-produced plasma X-ray sources using femtosecond laser pulses at 10Hz repetition rate in a table-top size in order to investigate basic mechanism of X-ray emission from laser-matter interactions and its application to a X-ray microscope. In a soft X-ray region over 5 nm wavelength, laser-plasma X-ray emission from a solid target achieved an intense flux of photons of the order of 1011 photons/rad per pulse with duration of a few 100 ps, which is intense enough to make a clear imaging in a short time exposure. As an application of laser-produced plasma X-ray source, we have developed a soft X-ray imaging microscope operating in the wavelength range around 14 nm. The microscope consists of a cylindrically ellipsoidal condenser mirror and a Schwarzshird objective mirror with highly-reflective multilayers. We report preliminary results of performance tests of the soft X-ray imaging microscope with a compact laser-produced plasma X-ray source

Advanced X-Ray Telescope Mirrors Provide Sharpest Focus Ever

Science.gov (United States)

1997-03-01

Performing beyond expectations, the high- resolution mirrors for NASA's most powerful orbiting X-ray telescope have successfully completed initial testing at Marshall Space Flight Center's X-ray Calibration Facility, Huntsville, AL. "We have the first ground test images ever generated by the telescope's mirror assembly, and they are as good as -- or better than -- expected," said Dr. Martin Weisskopf, Marshall's chief scientist for NASA's Advanced X-ray Astrophysics Facility (AXAF). The mirror assembly, four pairs of precisely shaped and aligned cylindrical mirrors, will form the heart of NASA's third great observatory. The X-ray telescope produces an image by directing incoming X-rays to detectors at a focal point some 30 feet beyond the telescope's mirrors. The greater the percentage of X-rays brought to focus and the smaller the size of the focal spot, the sharper the image. Tests show that on orbit, the mirror assembly of the Advanced X-ray Astrophysics Facility will be able to focus approximately 70 percent of X-rays from a source to a spot less than one-half arc second in radius. The telescope's resolution is equivalent to being able to read the text of a newspaper from half a mile away. "The telescope's focus is very clear, very sharp," said Weisskopf. "It will be able to show us details of very distant sources that we know are out there, but haven't been able to see clearly." In comparison, previous X-ray telescopes -- Einstein and Rosat -- were only capable of focusing X- rays to five arc seconds. The Advanced X-ray Telescope's resolving power is ten times greater. "Images from the new telescope will allow us to make major advances toward understanding how exploding stars create and disperse many of the elements necessary for new solar systems and for life itself," said Dr. Harvey Tananbaum, director of the Advanced X- ray Astrophysics Facility Science Center at the Smithsonian Astrophysical Observatory, in Cambridge, MA -- responsible for the telescope

Speckle-based at-wavelength metrology of X-ray mirrors with super accuracy.

Science.gov (United States)

Kashyap, Yogesh; Wang, Hongchang; Sawhney, Kawal

2016-05-01

X-ray active mirrors, such as bimorph and mechanically bendable mirrors, are increasingly being used on beamlines at modern synchrotron source facilities to generate either focused or "tophat" beams. As well as optical tests in the metrology lab, it is becoming increasingly important to optimise and characterise active optics under actual beamline operating conditions. Recently developed X-ray speckle-based at-wavelength metrology technique has shown great potential. The technique has been established and further developed at the Diamond Light Source and is increasingly being used to optimise active mirrors. Details of the X-ray speckle-based at-wavelength metrology technique and an example of its applicability in characterising and optimising a micro-focusing bimorph X-ray mirror are presented. Importantly, an unprecedented angular sensitivity in the range of two nanoradians for measuring the slope error of an optical surface has been demonstrated. Such a super precision metrology technique will be beneficial to the manufacturers of polished mirrors and also in optimization of beam shaping during experiments.

Simultaneous analysis of Grazing Incidence X-Ray reflectivity and X-ray standing waves from periodic multilayer systems

NARCIS (Netherlands)

Yakunin, S.N.; Makhotkin, Igor Alexandrovich; Chuyev, M.A.; Seregin, A.Y.; Pashayev, E.M.; Louis, Eric; van de Kruijs, Robbert Wilhelmus Elisabeth; Bijkerk, Frederik; Kovalchuk, M.V.

2012-01-01

Structural analysis of periodic multilayers with small period thickness (~4 nm) is a challenging task, especially when thicknesses of intermixed interfaces become comparable to individual layer thicknesses. In general, angular dependent X-ray fluorescence measurements, excited by the X-ray standing

Surface roughness evaluation on mandrels and mirror shells for future X-ray telescopes

Science.gov (United States)

Sironi, Giorgia; Spiga, D.

2008-07-01

More X-ray missions that will be operating in near future, like particular SIMBOL-X, e-Rosita, Con-X/HXT, SVOM/XIAO and Polar-X, will be based on focusing optics manufactured by means of the Ni electroforming replication technique. This production method has already been successfully exploited for SAX, XMM and Swift-XRT. Optical surfaces for X-ray reflection have to be as smooth as possible also at high spatial frequencies. Hence it will be crucial to take under control microroughness in order to reduce the scattering effects. A high rms microroughness would cause the degradation of the angular resolution and loss of effective area. Stringent requirements have therefore to be fixed for mirror shells surface roughness depending on the specific energy range investigated, and roughness evolution has to be carefully monitored during the subsequent steps of the mirror-shells realization. This means to study the roughness evolution in the chain mandrel, mirror shells, multilayer deposition and also the degradation of mandrel roughness following iterated replicas. Such a study allows inferring which phases of production are the major responsible of the roughness growth and could help to find solutions optimizing the involved processes. The exposed study is carried out in the context of the technological consolidation related to SIMBOL-X, along with a systematic metrological study of mandrels and mirror shells. To monitor the roughness increase following each replica, a multiinstrumental approach was adopted: microprofiles were analysed by means of their Power Spectral Density (PSD) in the spatial frequency range 1000-0.01 μm. This enables the direct comparison of roughness data taken with instruments characterized by different operative ranges of frequencies, and in particular optical interferometers and Atomic Force Microscopes. The performed analysis allowed us to set realistic specifications on the mandrel roughness to be achieved, and to suggest a limit for the

Gamma-ray mirror technology for NDA of spent fuel

Energy Technology Data Exchange (ETDEWEB)

Descalle, M. A. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Ruz-Armendariz, J. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Decker, T. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Alameda, J. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Brejnholt, N. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Soufli, R. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Robinson, J. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Dreyer, J. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Pivovaroff, M. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Ziock, K. [Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Chichester, D. [Idaho National Lab. (INL), Idaho Falls, ID (United States); Watson, S. [Idaho National Lab. (INL), Idaho Falls, ID (United States); Trellue, H. [Los Alamos National Lab. (LANL), Los Alamos, NM (United States)

2017-09-28

Direct measurements of gamma rays emitted by fissile material have been proposed as an alternative to measurements of the gamma rays from fission products. From a safeguards applications perspective, direct detection of uranium (U) and plutonium (Pu) K-shell fluorescence emission lines and specific lines from some of their isotopes could lead to improved shipper-receiver difference or input accountability at the start of Pu reprocessing. However, these measurements are difficult to implement when the spent fuel is in the line-of-sight of the detector, as the detector is exposed to high rates dominated by fission product emissions. To overcome the combination of high rates and high background, grazing incidence multilayer mirrors have been proposed as a solution to selectively reflect U and Pu hard X-ray and soft gamma rays in the 90 to 420 keV energy into a high-purity germanium (HPGe) detector shielded from the direct line-of-sight of spent fuel. Several groups demonstrated that K-shell fluorescence lines of U and Pu in spent fuel could be detected with Ge detectors. In the field of hard X-ray optics the performance of reflective multilayer coated reflective optics was demonstrated up to 645 keV at the European Synchrotron Radiation Facility. Initial measurements conducted at Oak Ridge National Laboratory with sealed sources and scoping experiments conducted at the ORNL Irradiated Fuels Examination Laboratory (IFEL) with spent nuclear fuel further demonstrated the pass-band properties of multilayer mirrors for reflecting specific emission lines into 1D and 2D HPGe detectors, respectively.

X-ray specular reflection and fluorescence study of nano-films

International Nuclear Information System (INIS)

Zheludeva, S.; Novikova, N.

2001-01-01

The techniques that combine the advantages of high-resolution structure sensitive x-ray methods with spectroscopic selectivity of data obtained are shown to be extremely promising for characterization of organic and inorganic nano films and nano structures. Fluorescence yield angular dependences exited by complicated evanescent wave / x-ray standing wave pattern at total reflection and glancing incidence can be used to detect structure position of different ions in organic systems and alien interfacial layers in inorganic multilayers;, to get information about interdiffusion at the interfaces of Langmuir- Blodgett (L-B) films and artificial inorganic - x-ray mirrors; to study ion permeation through L-B nano structures - models of biomembrans; to obtain nano - film thickness and density; to get precisely the parameters of small d-space multilayer mirrors, ets

Simbol-X Hard X-ray Focusing Mirrors: Results Obtained During the Phase A Study

Science.gov (United States)

Tagliaferri, G.; Basso, S.; Borghi, G.; Burkert, W.; Citterio, O.; Civitani, M.; Conconi, P.; Cotroneo, V.; Freyberg, M.; Garoli, D.; Gorenstein, P.; Hartner, G.; Mattarello, V.; Orlandi, A.; Pareschi, G.; Romaine, S.; Spiga, D.; Valsecchi, G.; Vernani, D.

2009-05-01

Simbol-X will push grazing incidence imaging up to 80 keV, providing a strong improvement both in sensitivity and angular resolution compared to all instruments that have operated so far above 10 keV. The superb hard X-ray imaging capability will be guaranteed by a mirror module of 100 electroformed Nickel shells with a multilayer reflecting coating. Here we will describe the technogical development and solutions adopted for the fabrication of the mirror module, that must guarantee an Half Energy Width (HEW) better than 20 arcsec from 0.5 up to 30 keV and a goal of 40 arcsec at 60 keV. During the phase A, terminated at the end of 2008, we have developed three engineering models with two, two and three shells, respectively. The most critical aspects in the development of the Simbol-X mirrors are i) the production of the 100 mandrels with very good surface quality within the timeline of the mission, ii) the replication of shells that must be very thin (a factor of 2 thinner than those of XMM-Newton) and still have very good image quality up to 80 keV, iii) the development of an integration process that allows us to integrate these very thin mirrors maintaining their intrinsic good image quality. The Phase A study has shown that we can fabricate the mandrels with the needed quality and that we have developed a valid integration process. The shells that we have produced so far have a quite good image quality, e.g. HEW <~30 arcsec at 30 keV, and effective area. However, we still need to make some improvements to reach the requirements. We will briefly present these results and discuss the possible improvements that we will investigate during phase B.

Simbol-X Hard X-ray Focusing Mirrors: Results Obtained During the Phase A Study

International Nuclear Information System (INIS)

Tagliaferri, G.; Basso, S.; Civitani, M.; Conconi, P.; Cotroneo, V.; Pareschi, G.; Spiga, D.; Borghi, G.; Garoli, D.; Mattarello, V.; Orlandi, A.; Valsecchi, G.; Vernani, D.; Burkert, W.; Freyberg, M.; Hartner, G.; Citterio, O.; Gorenstein, P.; Romaine, S.

2009-01-01

Simbol-X will push grazing incidence imaging up to 80 keV, providing a strong improvement both in sensitivity and angular resolution compared to all instruments that have operated so far above 10 keV. The superb hard X-ray imaging capability will be guaranteed by a mirror module of 100 electroformed Nickel shells with a multilayer reflecting coating. Here we will describe the technogical development and solutions adopted for the fabrication of the mirror module, that must guarantee an Half Energy Width (HEW) better than 20 arcsec from 0.5 up to 30 keV and a goal of 40 arcsec at 60 keV. During the phase A, terminated at the end of 2008, we have developed three engineering models with two, two and three shells, respectively. The most critical aspects in the development of the Simbol-X mirrors are i) the production of the 100 mandrels with very good surface quality within the timeline of the mission, ii) the replication of shells that must be very thin (a factor of 2 thinner than those of XMM-Newton) and still have very good image quality up to 80 keV, iii) the development of an integration process that allows us to integrate these very thin mirrors maintaining their intrinsic good image quality. The Phase A study has shown that we can fabricate the mandrels with the needed quality and that we have developed a valid integration process. The shells that we have produced so far have a quite good image quality, e.g. HEW < or approx. 30 arcsec at 30 keV, and effective area. However, we still need to make some improvements to reach the requirements. We will briefly present these results and discuss the possible improvements that we will investigate during phase B.

Thermal forming of glass microsheets for x-ray telescope mirror segments

DEFF Research Database (Denmark)

Jimenez-Garate, M.A.; Hailey, C.J.; Craig, W.W.

2003-01-01

envisioned for future x-ray observatories. The glass microsheets are shaped into mirror segments at high temperature by use of a guiding mandrel, without polishing. We determine the physical properties and mechanisms that elucidate the formation process and that are crucial to improve surface quality. We......We describe a technology to mass-produce ultrathin mirror substrates for x-ray telescopes of near Wolter-I geometry. Thermal glass forming is a low-cost method to produce high-throughput, spaceborne x-ray mirrors for the 0.1-200-keV energy band. These substrates can provide the collecting area...... develop a viscodynamic model for the glass strain as the forming proceeds to find the conditions for repeatability. Thermal forming preserves the x-ray reflectance and scattering properties of the raw glass. The imaging resolution is driven by a large wavelength figure. We discuss the sources of figure...

Speckle-based at-wavelength metrology of X-ray mirrors with super accuracy

International Nuclear Information System (INIS)

Kashyap, Yogesh; Wang, Hongchang; Sawhney, Kawal

2016-01-01

X-ray active mirrors, such as bimorph and mechanically bendable mirrors, are increasingly being used on beamlines at modern synchrotron source facilities to generate either focused or “tophat” beams. As well as optical tests in the metrology lab, it is becoming increasingly important to optimise and characterise active optics under actual beamline operating conditions. Recently developed X-ray speckle-based at-wavelength metrology technique has shown great potential. The technique has been established and further developed at the Diamond Light Source and is increasingly being used to optimise active mirrors. Details of the X-ray speckle-based at-wavelength metrology technique and an example of its applicability in characterising and optimising a micro-focusing bimorph X-ray mirror are presented. Importantly, an unprecedented angular sensitivity in the range of two nanoradians for measuring the slope error of an optical surface has been demonstrated. Such a super precision metrology technique will be beneficial to the manufacturers of polished mirrors and also in optimization of beam shaping during experiments.

Speckle-based at-wavelength metrology of X-ray mirrors with super accuracy

Energy Technology Data Exchange (ETDEWEB)

Kashyap, Yogesh; Wang, Hongchang; Sawhney, Kawal, E-mail: kawal.sawhney@diamond.ac.uk [Diamond Light Source, Harwell Science and Innovation Campus, Didcot OX11 0DE (United Kingdom)

2016-05-15

X-ray active mirrors, such as bimorph and mechanically bendable mirrors, are increasingly being used on beamlines at modern synchrotron source facilities to generate either focused or “tophat” beams. As well as optical tests in the metrology lab, it is becoming increasingly important to optimise and characterise active optics under actual beamline operating conditions. Recently developed X-ray speckle-based at-wavelength metrology technique has shown great potential. The technique has been established and further developed at the Diamond Light Source and is increasingly being used to optimise active mirrors. Details of the X-ray speckle-based at-wavelength metrology technique and an example of its applicability in characterising and optimising a micro-focusing bimorph X-ray mirror are presented. Importantly, an unprecedented angular sensitivity in the range of two nanoradians for measuring the slope error of an optical surface has been demonstrated. Such a super precision metrology technique will be beneficial to the manufacturers of polished mirrors and also in optimization of beam shaping during experiments.

A compact scanning soft X-ray microscope

International Nuclear Information System (INIS)

Trail, J.A.

1989-01-01

Soft x-ray microscopes operating at wavelengths between 2.3 nm and 4.4 nm are capable of imaging wet biological cells with a resolution many times that of a visible light microscope. Several such soft x-ray microscopes have been constructed. However, with the exception of contact microscopes, all use synchrotrons as the source of soft x-ray radiation and Fresnel zone plates as the focusing optics. These synchrotron based microscopes are very successful but have the disadvantage of limited access. This dissertation reviews the construction and performance of a compact scanning soft x-ray microscope whose size and accessibility is comparable to that of an electron microscope. The microscope uses a high-brightness laser-produced plasma as the soft x-ray source and normal incidence multilayer-coated mirrors in a Schwarzschild configuration as the focusing optics. The microscope operates at a wavelength of 14 nm, has a spatial resolution of 0.5 μm, and has a soft x-ray photon flux through the focus of 10 4 -10 5 s -1 when operated with only 170 mW of average laser power. The complete system, including the laser, fits on a single 4' x 8' optical table. The significant components of the compact microscope are the laser-produced plasma (LPP) source, the multilayer coatings, and the Schwarzschild objective. These components are reviewed, both with regard to their particular use in the current microscope and with regard to extending the microscope performance to higher resolution, higher speed, and operation at shorter wavelengths. Measurements of soft x-ray emission and debris emission from our present LPP source are presented and considerations given for an optimal LPP source. The LPP source was also used as a broadband soft x-ray source for measurement of normal incidence multilayer mirror reflectance in the 10-25 nm spectral region

Using refractive optics to broaden the focus of an X-ray mirror.

Science.gov (United States)

Laundy, David; Sawhney, Kawal; Dhamgaye, Vishal

2017-07-01

X-ray mirrors are widely used at synchrotron radiation sources for focusing X-rays into focal spots of size less than 1 µm. The ability of the beamline optics to change the size of this spot over a range up to tens of micrometres can be an advantage for many experiments such as X-ray microprobe and X-ray diffraction from micrometre-scale crystals. It is a requirement that the beam size change should be reproducible and it is often essential that the change should be rapid, for example taking less than 1 s, in order to allow high data collection rates at modern X-ray sources. In order to provide a controlled broadening of the focused spot of an X-ray mirror, a series of refractive optical elements have been fabricated and installed immediately before the mirror. By translation, a new refractive element is moved into the X-ray beam allowing a variation in the size of the focal spot in the focusing direction. Measurements using a set of prefabricated refractive structures with a test mirror showed that the focused beam size could be varied from less than 1 µm to over 10 µm for X-rays in the energy range 10-20 keV. As the optics is in-line with the X-ray beam, there is no effect on the centroid position of the focus. Accurate positioning of the refractive optics ensures reproducibility in the focused beam profile and no additional re-alignment of the optics is required.

Null Lens Assembly for X-Ray Mirror Segments

Science.gov (United States)

Robinson, David W.

2011-01-01

A document discusses a null lens assembly that allows laser interferometry of 60 deg. slumped glass mirror segments used in x-ray mirrors. The assembly consists of four lenses in precise alignment to each other, with incorporated piezoelectric nanometer stepping actuators to position the lenses in six degrees of freedom for positioning relative to each other.

Design, Construction, and Testing of Lightweight X-ray Mirror Modules

Science.gov (United States)

McClelland, Ryan S.; Biskach, Michael P.; Chan, Kai-Wing; Espina, Rebecca A.; Hohl, Bruce R.; Matson, Elizabeth A.; Saha, Timo C.; Zhang, William W.

2013-01-01

Lightweight and high resolution optics are needed for future space-based X-ray telescopes to achieve advances in high-energy astrophysics. The Next Generation X-ray Optics (NGXO) team at NASA GSFC is nearing mission readiness for a 10 arc-second Half Power Diameter (HPD) slumped glass mirror technology while laying the groundwork for a future 1-2 arc-second technology based on polished silicon mirrors. Technology Development Modules (TDMs) have been designed, fabricated, integrated with mirrors segments, and extensively tested to demonstrate technology readiness. Tests include X-ray performance, thermal vacuum, acoustic load, and random vibration. The thermal vacuum and acoustic load environments have proven relatively benign, while the random vibration environment has proven challenging due to large input amplification at frequencies above 500 Hz. Epoxy selection, surface preparation, and larger bond area have increased bond strength while vibration isolation has decreased vibration amplification allowing for space launch requirements to be met in the near term. The next generation of TDMs, which demonstrates a lightweight structure supporting more mirror segments, is currently being fabricated. Analysis predicts superior performance characteristics due to the use of E-60 Beryllium-Oxide Metal Matrix Composite material, with only a modest cost increase. These TDMs will be larger, lighter, stiffer, and stronger than the current generation. Preliminary steps are being taken to enable mounting and testing of 1-2 arc-second mirror segments expected to be available in the future. A Vertical X-ray Test Facility (VXTF) will minimize module gravity distortion and allow for less constrained mirror mounts, such as fully kinematic mounts. Permanent kinematic mounting into a modified TDM has been demonstrated to achieve 2 arc-second level distortion free alignment.

A parabolic mirror x-ray collimator

Science.gov (United States)

Franks, A.; Jackson, K.; Yacoot, A.

2000-05-01

A robust and stable x-ray collimator has been developed to produce a parallel beam of x-rays by total external reflection from a parabolic mirror. The width of the gold-coated silica mirror varies along its length, which allows it to be bent from a plane surface into a parabolic form by application of unequal bending forces at its ends. A family of parabolas of near constant focal length can be formed by changing the screw-applied bending force, thus allowing the collimator to cater for a range of wavelengths by the turning of a screw. Even with radiation with a wavelength as short as that as Mo Kicons/Journals/Common/alpha" ALT="alpha" ALIGN="TOP"/> 1 (icons/Journals/Common/lambda" ALT="lambda" ALIGN="TOP"/> = 0.07 nm), a gain in flux by a factor of 5.5 was achieved. The potential gain increases with wavelength, e.g. for Cu Kicons/Journals/Common/alpha" ALT="alpha" ALIGN="TOP"/> 1 radiation this amounts to over a factor of ten.

DABAM: an open-source database of X-ray mirrors metrology

Energy Technology Data Exchange (ETDEWEB)

Sanchez del Rio, Manuel, E-mail: srio@esrf.eu [ESRF - The European Synchrotron, 71 Avenue des Martyrs, 38000 Grenoble (France); Bianchi, Davide [AC2T Research GmbH, Viktro-Kaplan-Strasse 2-C, 2700 Wiener Neustadt (Austria); Cocco, Daniele [SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, CA 94025 (United States); Glass, Mark [ESRF - The European Synchrotron, 71 Avenue des Martyrs, 38000 Grenoble (France); Idir, Mourad [NSLS II, Brookhaven National Laboratory, Upton, NY 11973-5000 (United States); Metz, Jim [InSync Inc., 2511C Broadbent Parkway, Albuquerque, NM 87107 (United States); Raimondi, Lorenzo; Rebuffi, Luca [Elettra-Sincrotrone Trieste SCpA, Basovizza (TS) (Italy); Reininger, Ruben; Shi, Xianbo [Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439 (United States); Siewert, Frank [BESSY II, Helmholtz Zentrum Berlin, Institute for Nanometre Optics and Technology, Albert-Einstein-Strasse 15, 12489 Berlin (Germany); Spielmann-Jaeggi, Sibylle [Swiss Light Source at Paul Scherrer Institut, CH-5232 Villigen PSI (Switzerland); Takacs, Peter [Instrumentation Division, Brookhaven National Laboratory, Upton, NY 11973-5000 (United States); Tomasset, Muriel [Synchrotron Soleil (France); Tonnessen, Tom [InSync Inc., 2511C Broadbent Parkway, Albuquerque, NM 87107 (United States); Vivo, Amparo [ESRF - The European Synchrotron, 71 Avenue des Martyrs, 38000 Grenoble (France); Yashchuk, Valeriy [Advanced Light Source, Lawrence Berkeley National Laboratory, MS 15-R0317, 1 Cyclotron Road, Berkeley, CA 94720-8199 (United States)

2016-04-20

DABAM, an open-source database of X-ray mirrors metrology to be used with ray-tracing and wave-propagation codes for simulating the effect of the surface errors on the performance of a synchrotron radiation beamline. An open-source database containing metrology data for X-ray mirrors is presented. It makes available metrology data (mirror heights and slopes profiles) that can be used with simulation tools for calculating the effects of optical surface errors in the performances of an optical instrument, such as a synchrotron beamline. A typical case is the degradation of the intensity profile at the focal position in a beamline due to mirror surface errors. This database for metrology (DABAM) aims to provide to the users of simulation tools the data of real mirrors. The data included in the database are described in this paper, with details of how the mirror parameters are stored. An accompanying software is provided to allow simple access and processing of these data, calculate the most usual statistical parameters, and also include the option of creating input files for most used simulation codes. Some optics simulations are presented and discussed to illustrate the real use of the profiles from the database.

Characterization of X-UV multilayers by grazing incidence X-ray reflectometry

International Nuclear Information System (INIS)

Nevot, L.; Pardo, B.; Corno, J.

1988-01-01

The performance of multilayers at the X-UV wavelengths depends upon the structural and geometrical imperfections of the deposited materials. These two respective contributions are not easily separated when only one Bragg peak is recorded, as is usually the case in the X-UV range, so a prediction of the performance at other wavelengths appears rather doubtful. We show how grazing incidence X-ray reflectometry (using Cu Kα 1 radiation) allows the precise evaluation of both interfacial roughnesses and thickness errors, as well as their variations through the stacks. As examples, we analyse three (W/C) multilayers with periods between 3 to 6 nm and up to 40 layers

X-ray radiation effects in multilayer epitaxial graphene

Energy Technology Data Exchange (ETDEWEB)

Hicks, Jeremy; Tinkey, Holly; Hankinson, John; Heer, Walt A. de; Conrad, Edward H. [School of Physics, Georgia Institute of Technology, Atlanta, Georgia 30332 (United States); Arora, Rajan; Kenyon, Eleazar; Chakraborty, Partha S.; Cressler, John D. [School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332 (United States); Berger, Claire [School of Physics, Georgia Institute of Technology, Atlanta, Georgia 30332 (United States); CNRS-Institut Neel, BP 166, 38042 Grenoble Cedex 9 (France)

2011-12-05

We characterize multilayer graphene grown on C-face SiC before and after exposure to a total ionizing dose of 12 Mrad(SiO{sub 2}) using a 10 keV x-ray source. While we observe the partial peeling of the top graphene layers and the appearance of a modest Raman D-peak, we find that the electrical characteristics (mobility, sheet resistivity, free carrier concentration) of the material are mostly unaffected by radiation exposure. Combined with x-ray photoelectron spectroscopy data showing numerous carbon-oxygen bonds after irradiation, we conclude that the primary damage mechanism is through surface etching from reactive oxygen species created by the x-rays.

Achromatic nested Kirkpatrick–Baez mirror optics for hard X-ray nanofocusing

International Nuclear Information System (INIS)

Liu, Wenjun; Ice, Gene E.; Assoufid, Lahsen; Liu, Chian; Shi, Bing; Khachatryan, Ruben; Qian, Jun; Zschack, Paul; Tischler, Jonathan Z.; Choi, J.-Y.

2011-01-01

A nested Kirkpatrick–Baez mirror pair has been designed, fabricated and tested for achromatic nanofocusing synchrotron hard X-rays. The prototype system achieved a FWHM focal spot of about 150 nm in both horizontal and vertical directions. The first test of nanoscale-focusing Kirkpatrick–Baez (KB) mirrors in the nested (or Montel) configuration used at a hard X-ray synchrotron beamline is reported. The two mirrors are both 40 mm long and coated with Pt to produce a focal length of 60 mm at 3 mrad incident angle, and collect up to a 120 µm by 120 µm incident X-ray beam with maximum angular acceptance of 2 mrad and a broad bandwidth of energies up to 30 keV. In an initial test a focal spot of about 150 nm in both horizontal and vertical directions was achieved with either polychromatic or monochromatic beam. The nested mirror geometry, with two mirrors mounted side-by-side and perpendicular to each other, is significantly more compact and provides higher demagnification than the traditional sequential KB mirror arrangement. Ultimately, nested mirrors can focus larger divergence to improve the diffraction limit of achromatic optics. A major challenge with the fabrication of the required mirrors is the need for near-perfect mirror surfaces near the edge of at least one of the mirrors. Special polishing procedures and surface profile coating were used to preserve the mirror surface quality at the reflecting edge. Further developments aimed at achieving diffraction-limited focusing below 50 nm are underway

Fabrication of nested elliptical KB mirrors using profile coating for synchrotron radiation X-ray focusing

International Nuclear Information System (INIS)

Liu Chian; Ice, G.E.; Liu, W.; Assoufid, L.; Qian, J.; Shi, B.; Khachatryan, R.; Wieczorek, M.; Zschack, P.; Tischler, J.Z.

2012-01-01

This paper describes fabrication methods used to demonstrate the advantages of nested or Montel optics for micro/nanofocusing of synchrotron X-ray beams. A standard Kirkpatrick-Baez (KB) mirror system uses two separated elliptical mirrors at glancing angles to the X-ray beam and sequentially arranged at 90° to each other to focus X-rays successively in the vertical and horizontal directions. A nested KB mirror system has the two mirrors positioned perpendicular and side-by-side to each other. Compared to a standard KB mirror system, Montel optics can focus a larger divergence and the mirrors can have a shorter focal length. As a result, nested mirrors can be fabricated with improved demagnification factor and ultimately smaller focal spot, than with a standard KB arrangement. The nested system is also more compact with an increased working distance, and is more stable, with reduced complexity of mirror stages. However, although Montel optics is commercially available for laboratory X-ray sources, due to technical difficulties they have not been used to microfocus synchrotron radiation X-rays, where ultra-precise mirror surfaces are essential. The main challenge in adapting nested optics for synchrotron microfocusing is to fabricate mirrors with a precise elliptical surface profile at the very edge where the two mirrors meet and where X-rays scatter. For example, in our application to achieve a sub-micron focus with high efficiency, a surface figure root-mean-square (rms) error on the order of 1 nm is required in the useable area along the X-ray footprint with a ∼0.1 mm-diameter cross section. In this paper we describe promising ways to fabricate precise nested KB mirrors using our profile coating technique and inexpensive flat Si substrates.

Design and performance of capping layers for extreme-ultraviolet multilayer mirrors

International Nuclear Information System (INIS)

Bajt, Sasa; Chapman, Henry N.; Nguyen, Nhan; Alameda, Jennifer; Robinson, Jeffrey C.; Malinowski, Michael; Gullikson, Eric; Aquila, Andrew; Tarrio, Charles; Grantham, Steven

2003-01-01

Multilayer lifetime has emerged as one of the major issues for the commercialization of extreme-ultraviolet lithography (EUVL). We describe the performance of an oxidation-resistant capping layer of Ru atop multilayers that results in a reflectivity above 69% at 13.2 nm, which is suitable for EUVL projection optics and has been tested with accelerated electron-beam and extreme-ultraviolet (EUV) light in a water-vapor environment. Based on accelerated exposure results, we calculated multilayer lifetimes for all reflective mirrors in a typical commercial EUVL tool and concluded that Ru-capped multilayers have ∼40x longer lifetimes than Si-capped multilayers, which translates to 3 months to many years, depending on the mirror dose

Design studies for ITER x-ray diagnostics

International Nuclear Information System (INIS)

Hill, K.W.; Bitter, M.; von Goeler, S.; Hsuan, H.

1995-01-01

Concepts for adapting conventional tokamak x-ray diagnostics to the harsh radiation environment of ITER include use of grazing-incidence (GI) x-ray mirrors or man-made Bragg multilayer (ML) elements to remove the x-ray beam from the neutron beam, or use of bundles of glass-capillary x-ray ''light pipes'' embedded in radiation shields to reduce the neutron/gamma-ray fluxes onto the detectors while maintaining usable x-ray throughput. The x-ray optical element with the broadest bandwidth and highest throughput, the GI mirror, can provide adequate lateral deflection (10 cm for a deflected-path length of 8 m) at x-ray energies up to 12, 22, or 30 keV for one, two, or three deflections, respectively. This element can be used with the broad band, high intensity x-ray imaging system (XIS), the pulseheight analysis (PHA) survey spectrometer, or the high resolution Johann x-ray crystal spectrometer (XCS), which is used for ion-temperature measurement. The ML mirrors can isolate the detector from the neutron beam with a single deflection for energies up to 50 keV, but have much narrower bandwidth and lower x-ray power throughput than do the GI mirrors; they are unsuitable for use with the XIS or PHA, but they could be used with the XCS; in particular, these deflectors could be used between ITER and the biological shield to avoid direct plasma neutron streaming through the biological shield. Graded-d ML mirrors have good reflectivity from 20 to 70 keV, but still at grazing angles (<3 mrad). The efficiency at 70 keV for double reflection (10 percent), as required for adequate separation of the x-ray and neutron beams, is high enough for PHA requirements, but not for the XIS. Further optimization may be possible

Soft X-ray images of the solar corona using normal incidence optics

Science.gov (United States)

Bruner, M. E.; Haisch, B. M.; Brown, W. A.; Acton, L. W.; Underwood, J. H.

1988-01-01

A solar coronal loop system has been photographed in soft X-rays using a normal incidence telescope based on multilayer mirror technology. The telescope consisted of a spherical objective mirror of 4 cm aperture and 1 m focal length, a film cassette, and a focal plane shutter. A metallized thin plastic film filter was used to exclude visible light. The objective mirror was covered with a multilayer coating consisting of alternating layers of tungsten and carbon whose combined thicknesses satisfied the Bragg diffraction condition for 44 A radiation. The image was recorded during a rocket flight on October 25, 1985 and was dominated by emission lines arising from the Si XII spectrum. The rocket also carried a high resolution soft X-ray spectrograph that confirmed the presence of Si XII line radiation in the source. This image represents the first successful use of multilayer technology for astrophysical observations.

Ray-tracing of shape metrology data of grazing incidence x-ray astronomy mirrors

Science.gov (United States)

Zocchi, Fabio E.; Vernani, Dervis

2008-07-01

A number of future X-ray astronomy missions (e.g. Simbol-X, eROSITA) plan to utilize high throughput grazing incidence optics with very lightweight mirrors. The severe mass specifications require a further optimization of the existing technology with the consequent need of proper optical numerical modeling capabilities for both the masters and the mirrors. A ray tracing code has been developed for the simulation of the optical performance of type I Wolter masters and mirrors starting from 2D and 3D metrology data. In particular, in the case of 2D measurements, a 3D data set is reconstructed on the basis of dimensional references and used for the optical analysis by ray tracing. In this approach, the actual 3D shape is used for the optical analysis, thus avoiding the need of combining the separate contributions of different 2D measurements that require the knowledge of their interactions which is not normally available. The paper describes the proposed approach and presents examples of application on a prototype engineering master in the frame of ongoing activities carried out for present and future X-ray missions.

Metrology and Alignment of Light Weight Grazing Incidence X-Ray Mirrors

Science.gov (United States)

Zhang, William; Content, David; Petre, Robert; Saha, Timo

2000-01-01

Metrology and alignment of light weight X-ray optics have been a challenge for two reasons: (1) that the intrinsic mirror quality and distortions caused by handling can not be easily separated, and (2) the diffraction limits of the visible light become a severe problem at the order of one arc-minute. Traditional methods of using a normal incident pencil or small parallel beam which monitors a tiny fraction of the mirror in question at a given time can not adequately monitor those distortions. We are developing a normal incidence setup that monitors a large fraction, if not the whole, of the mirror at any given time. It will allow us to align thin X-ray mirrors to-an accuracy of a few arc seconds or to a limit dominated by the mirror intrinsic quality.

Thermal management of next-generation contact-cooled synchrotron x-ray mirrors

Energy Technology Data Exchange (ETDEWEB)

Khounsary, A.

1999-10-29

In the past decade, several third-generation synchrotrons x-ray sources have been constructed and commissioned around the world. Many of the major problems in the development and design of the optical components capable of handling the extremely high heat loads of the generated x-ray beams have been resolved. It is expected, however, that in the next few years even more powerful x-ray beams will be produced at these facilities, for example, by increasing the particle beam current. In this paper, the design of a next generation of synchrotron x-ray mirrors is discussed. The author shows that the design of contact-cooled mirrors capable of handing x-ray beam heat fluxes in excess of 500 W/mm{sup 2} - or more than three times the present level - is well within reach, and the limiting factor is the thermal stress rather then thermally induced slope error.

X-ray diffraction of multilayers and superlattices

International Nuclear Information System (INIS)

Bartels, W.J.; Hornstra, J.; Lobeek, D.J.W.

1986-01-01

Recursion formulae for calculating the reflected amplitude ratio of multilayers and superlattices have been derived from the Takagi-Taupin differential equations, which describe the dynamical diffraction of X-rays in deformed crystals. Calculated rocking curves of complicated layered structures, such as non-ideal superlattices on perfect crystals, are shown to be in good agreement with observed diffraction profiles. The kinematical theory can save computing time only in the case of an ideal superlattice, for which a geometric series can be used, but the reflections must be below 10% so that multiple reflections can be neglected. For a perfect crystal of arbitrary thickness the absorption at the center of the dynamical reflection is found to be proportional to the square root of the reflectivity. Sputter-deposited periodic multilayers of tungsten and carbon can be considered as an artificial crystal, for which dynamical X-ray diffraction calculations give results very similar to those of a macroscopic optical description in terms of the complex index of refraction and Fresnel reflection coefficients. (orig.)

Simbol-X Mirror Module Thermal Shields: II-Small Angle X-Ray Scattering Measurements

Science.gov (United States)

Barbera, M.; Ayers, T.; Collura, A.; Nasillo, G.; Pareschi, G.; Tagliaferri, G.

2009-05-01

The formation flight configuration of the Simbol-X mission implies that the X-ray mirror module will be open to Space on both ends. In order to reduce the power required to maintain the thermal stability and, therefore, the high angular resolution of the shell optics, a thin foil thermal shield will cover the mirror module. Different options are presently being studied for the foil material of these shields. We report results of an experimental investigation conducted to verify that the scattering of X-rays, by interaction with the thin foil material of the thermal shield, will not significantly affect the performances of the telescope.

Simbol-X Mirror Module Thermal Shields: II-Small Angle X-Ray Scattering Measurements

International Nuclear Information System (INIS)

Barbera, M.; Ayers, T.; Collura, A.; Nasillo, G.; Pareschi, G.; Tagliaferri, G.

2009-01-01

The formation flight configuration of the Simbol-X mission implies that the X-ray mirror module will be open to Space on both ends. In order to reduce the power required to maintain the thermal stability and, therefore, the high angular resolution of the shell optics, a thin foil thermal shield will cover the mirror module. Different options are presently being studied for the foil material of these shields. We report results of an experimental investigation conducted to verify that the scattering of X-rays, by interaction with the thin foil material of the thermal shield, will not significantly affect the performances of the telescope.

Fatigue expectations in a molybdenum/silicon multilayer under pulsed soft X-ray radiation

International Nuclear Information System (INIS)

Weber, F.J.; Kassner, M.E.; Stearns, D.G.

1995-01-01

The temperature rise in a Mo/a-Si multilayer x-ray reflective film due to radiation absorption is modeled for the first condenser mirror in a projection lithography system such as the one designed by the Advanced Microtechnology Program at LLNL. The radiation load is pulsed at 1000 Hz with a time average intensity of 500mW/cm 2 . This intensity is the expected maximum on the first condenser mirror. The temperature rise is calculated using the integral transform technique. The film is assumed to have the thermal properties of its poorly conducting substrate, yielding a more conservative (higher) temperature estimate. The surface temperature rise is found to range between 35.6 degrees C and 76.3 degrees C. The stress due to this rise is greatest in the molybdenum film and ranges between 73MPa and 166MPa compressive. This fluctuating stress level, however, is believed to be insufficient, by a factor of five or so, to cause fatigue failure of the film

Preliminary investigation of changes in x-ray multilayer optics subjected to high radiation flux

International Nuclear Information System (INIS)

Hockaday, M.P.; Blake, R.L.; Grosso, J.S.; Selph, M.M.; Klein, M.M.; Matuska, W. Jr.; Palmer, M.A.; Liefeld, R.J.

1985-01-01

A variety of metal multilayers was exposed to high x-ray flux using Sandia National Laboratories' PROTO II machine in the gas puff mode. Fluxes incident on the multilayers above 700 MW/cm 2 in total radiation, in nominal 20 ns pulses, were realized. The neon hydrogen- and helium-like resonance lines were used to probe the x-ray reflectivity properties of the multilayers as they underwent change of state during the heating pulse. A fluorescer-fiber optic-streak camera system was used to monitor the changes in x-ray reflectivity as a function of time and irradiance. Preliminary results are presented for a W/C multilayer. Work in progress to model the experiment is discussed. 13 refs., 4 figs

Paraboloidal X-ray telescope mirror for solar coronal spectroscopy

Science.gov (United States)

Brown, W. A.; Bruner, E. C., Jr.; Acton, L. W.; Franks, A.; Stedman, M.; Speer, R. J.

1979-01-01

The telescope mirror for the X-ray Spectrograph Spectrometer Telescope System is a sixty degree sector of an extreme off-axis paraboloid of revolution. It was designed to focus a coronal region 1 by 10 arc seconds in size on the entrance slit of the spectrometer after reflection from the gold surface. This paper discusses the design, manufacture, and metrology of the mirror, the methods of precision mechanical metrology used to focus the system, and the mounting system which locates the mirror and has proven itself through vibration tests. In addition, the results of reflection efficiency measurements, alignment tolerances, and ray trace analysis of the effects of misalignment are considered.

A hard X-ray telescope/concentrator design based on graded period multilayer coatings

DEFF Research Database (Denmark)

Christensen, Finn Erland; Joensen, K. D.; Gorenstein, P.

1995-01-01

It is shown that compact designs of multifocus, conical approximations to highly nested Wolter I telescopes, as well as single reflection concentrators, employing realistic graded period W/Si or Ni/C multilayer coatings, allow one to obtain more than 1000 cm2 of on-axis effective area at 40 ke...... that it is smaller than roughly 1 mm. The design can be realized with foils as thin (≤0.4 mm) as used for ASCA and SODART or with closed, slightly thicker (∼1.0 mm) mirror shells as used for JET-X and XMM. The effect of an increase of the inner radius is quantified on the effective area for multilayered mirrors up...

Soft X-ray spectrographs for solar observations

Science.gov (United States)

Bruner, M. E.

1988-01-01

Recent advances in soft X-ray spectrometery are reviewed, with emphasis on techniques for studying the windowless region from roughly 1-100 A. Recent technological developments considered include multilayer mirrors, large-format CCD detectors which are sensitive to X-rays, position-sensitive photon counting detectors, new kinds of X-ray films, and optical systems based on gratings with nonuniform ruling spacings. Improvements in the extent and accuracy of the atomic physics data sets on which the analysis of spectroscopic observatons depend are also discussed.

A refined model for characterizing x-ray multilayers

International Nuclear Information System (INIS)

Oren, A.L.; Henke, B.L.

1987-12-01

The ability to quickly and accurately characterize arbitrary multilayers is very valuable for not only can we use the characterizations to predict the reflectivity of a multilayer for any soft x-ray wavelength, we also can generalize the results to apply to other multilayers of the same type. In addition, we can use the characterizations as a means of evaluating various sputtering environments and refining sputtering techniques to obtain better multilayers. In this report we have obtained improved characterizations for sample molybdenum-silicon and vanadium-silicon multilayers. However, we only examined five crystals overall, so the conclusions that we could draw about the structure of general multilayers is limited. Research involving many multilayers manufactured under the same sputtering conditions is clearly in order. In order to best understand multilayer structures it may be necessary to further refine our model, e.g., adopting a Gaussian form for the interface regions. With such improvements we can expect even better agreement with experimental values and continued concurrence with other characterization techniques. 18 refs., 30 figs., 7 tabs

Thin Mirror Shaping Technology for High-Throughput X-ray Telescopes

Science.gov (United States)

Schattenburg, Mark

This proposal is submitted to the NASA Research Opportunities in Space and Earth Sciences program (ROSES-2012) in response to NASA Research Announcement NNH12ZDA001N- APRA. It is targeted to the Astronomy and Astrophysics Research and Analysis (APRA) program element under the Supporting Technology category. Powerful x-ray telescope mirrors are critical components of a raft of small-to-large mission concepts under consideration by NASA. The science questions addressed by these missions have certainly never been more compelling and the need to fulfill NASA s core missions of exploring the universe and strengthening our nation s technology base has never been greater. Unfortunately, budgetary constraints are driving NASA to consider the cost/benefit and risk factors of new missions more carefully than ever. New technology for producing x-ray telescopes with increased resolution and collecting area, while holding down cost, are key to meeting these goals and sustaining a thriving high-energy astrophysics enterprise in the US. We propose to develop advanced technology which will lead to thin-shell x-ray telescope mirrors rivaling the Chandra x-ray telescope in spatial resolution but with 10-100X larger area all at significantly reduced weight, risk and cost. The proposed effort builds on previous research at MIT and complements NASA-supported research at other institutions. We are currently pursuing two thin-mirror technology development tracks which we propose to extend and accelerate with NASA support. The first research track utilizes rapidly-maturing thermal glass slumping technology which uses porous ceramic air-bearing mandrels to shape glass mirrors without touching, thus avoiding surface-induced mid-range spatial frequency ripples. A second research track seeks to remove any remaining mid- to long-range errors in mirrors by using scanning ion-beam implant to impart small, highly deterministic and very stable amounts of stress into thin glass, utilizing local

X-ray scattering from thin organic films and multilayer

International Nuclear Information System (INIS)

Pietsch, U.; Barberka, T. A.; Geue, Th.; Stoemmer, R.

1997-01-01

The real structure of LB-multilayers prepared with fatty-acid salts is dominated by finite-sized scattering aggregates. Their different length scales become visible using AFM. It shows that not the whole substrate is wetted by the film. The molecular order is restricted into domains. These micrometer domains are not homogeneous. They contain mesoscopic subdomains of different heights which vary in steps of double layers. Finally high-resolution AFM-maps display a nearly hexagonal arrangement of molecules within subgrains with a diameter of several 10 nm. This domain structure has to be taken into account when interpreting X-ray diffraction data. The size of the crystalline aggregates is obtained by means of X-ray grazing incidence diffraction. On the mesoscopic scale the domain size is determined by X-ray diffuse scattering experiments. Because Sinha's model fails for the present kind of multilayers, they used another approach for data analysis. The lateral correlation length caused by height fluctuations is estimated without knowledge of a definite correlation function. Additionally the mosaicity of the domain orientation can be taken into account

W/SiC X-ray multilayers optimized for use above 100 keV

DEFF Research Database (Denmark)

Windt, D.L.; Dongey, S.; Hailey, C.J.

2002-01-01

-derived optical constants, which we determined from reflectance-vs-incidence angle measurements also made using synchrotron radiation, in the range E=120 - 180 keV. We describe our experimental investigation in detail, compare the new W/SiC multilayers with both W/Si and W/B4C films that have been studied......We have developed a new depth-graded multilayer system comprising W and SiC layers, suitable for use as hard X-ray reflective coatings operating in the energy range 100 - 200 keV. Grazing incidence X-ray reflectance at E=8 keV was used to characterize the interface widths, as well as the temporal...... and thermal stability in both periodic and depth-graded W/SiC structures, while synchrotron radiation was used to measure the hard X-ray reflectance of a depth-graded multilayer designed specifically for use in the range Esimilar to150 - 170 keV. We have modeled the hard X-ray reflectance using newly...

W/SiC x-ray multilayers optimized for use above 100 keV

DEFF Research Database (Denmark)

Windt, D.L.; Donguy, S.; Hailey, C.J.

2003-01-01

optical constants, which we determined from reflectance versus incidence angle measurements also made using synchrotron radiation, in the range E = 120-180 keV. We describe our experimental investigation in detail, compare the new W/SiC multilayers with both W/Si and W/B4C films that have been studied......We have developed a new depth-graded multilayer system comprising W and SiC layers, suitable for use as hard x-ray reflective coatings operating in the energy range 100-200 keV. Grazing-incidence x-ray reflectance at E = 8 keV was used to characterize the interface widths, as well as the temporal...... and thermal stability in both periodic and depth-graded W/SiC structures, whereas synchrotron radiation was used to measure the hard x-ray reflectance of a depth-graded multilayer designed specifically for use in, the range Esimilar to150-170 keV. We have modeled the hard x-ray reflectance using newly derived...

Process of constructing a lightweight x-ray flight mirror assembly

Science.gov (United States)

McClelland, Ryan S.; Biskach, Michael P.; Chan, Kai-Wing; Espina, Rebecca A.; Hohl, Bruce R.; Saha, Timo T.; Zhang, William W.

2014-07-01

Lightweight and high resolution optics are needed for future space-based x-ray telescopes to achieve advances in highenergy astrophysics. NASA's Next Generation X-ray Optics (NGXO) project has made significant progress towards building such optics, both in terms of maturing the technology for spaceflight readiness and improving the angular resolution. Technology Development Modules (TDMs) holding three pairs of mirrors have been regularly and repeatedly integrated and tested both for optical performance and mechanical strength. X-ray test results have been improved over the past year from 10.3 arc-seconds Half Power Diameter (HPD) to 8.3 arc-seconds HPD. A vibration test has been completed to NASA standard verification levels showing the optics can survive launch and pointing towards improvements in strengthening the modules through redundant bonds. A Finite Element Analysis (FEA) study was completed which shows the mirror distortion caused by bonding is insensitive to the number of bonds. Next generation TDMs, which will demonstrate a lightweight structure and mount additional pairs of mirrors, have been designed and fabricated. The light weight of the module structure is achieved through the use of E-60 Beryllium Oxide metal matrix composite material. As the angular resolution of the development modules has improved, gravity distortion during horizontal x-ray testing has become a limiting factor. To address this issue, a facility capable of testing in the vertical orientation has been designed and planned. Test boring at the construction site suggest standard caisson construction methods can be utilized to install a subterranean vertical vacuum pipe. This facility will also allow for the testing of kinematically mounted mirror segments, which greatly reduces the effect of bonding displacements. A development platform demonstrating the feasibility of kinematically mounting mirror segments has been designed, fabricated, and successfully tested.

Development of the water window imaging x-ray microscope

International Nuclear Information System (INIS)

Hoover, R.B.; Shealy, D.L.; Baker, P.C.; Barbee, T.W. Jr.; Walker, A.B.C. Jr.

1991-01-01

This paper reports on the Water Window Imaging X-ray Microscopy which is currently being developed by a consortium from the Marshall Space Flight Center, the University of Alabama at Birmingham, Baker Consulting, the Lawrence Livermore National Laboratory, and Stanford University. The high quality solar images achieved during the Stanford/MSFC/LLNL Rocket X-ray Spectroheliograph flight conclusively established that excellent imaging could be obtained with doubly reflecting multilayer optical systems. Theoretical studies carried out as part of the MSFC X-ray Microscopy Program, demonstrated that high quality, high resolution multilayer x-ray imaging microscopes could be achieved with spherical optics in the Schwarzschild configuration and with Aspherical optical systems. Advanced Flow Polishing methods have been used to fabricate substrates for multilayer optics. On hemlite grade Sapphire, the authors have achieved microscopy mirror substrates on concave and convex spherical surfaces with 0.5 Angstrom rms surface smoothness, as measured by the Zygo profilometer. In this paper the authors report on the current status of fabrication and testing of the optical and mechanical subsystems for the Water Window Imaging X-ray Microscope

Kirkpatrick-Baez microscope with spherical multilayer mirrors around 2.5keV photon energy

Science.gov (United States)

An, Ning; Du, Xuewei; Wang, Qiuping; Cao, Zhurong; Jiang, Shaoen; Ding, Yongkun

2014-09-01

A Kirkpatrick-Baez (KB) x-ray microscope has been developed for the diagnostics of inertial confinement fusion (ICF). The KB microscope system works around 2.5keV with the magnification of 20. It consists of two spherical multilayer mirrors. The grazing angle is 3.575° at 2.5keV. The influence of the slope error of optical components and the alignment errors is simulated by SHADOW software. The mechanical structure which can perform fine tuning is designed. Experiment result with Manson x-ray source shows that the spatial resolution of the system is about 3-4μm over a field of view of 200μm.

X-ray scattering in giant magneto-resistive multilayers

International Nuclear Information System (INIS)

Fulthorpe, B.D.

1999-01-01

The scattering mechanisms responsible for Giant Magneto-Resistance (GMR) in magnetic multilayers are believed to be related to many aspects of the multilayer structure. X-ray scattering techniques provide a powerful method with which to study the bulk and interface morphology in these systems, and are therefore crucial in developing an understanding of the dominant factors influencing the magnitude of the GMR. Reflectivity measurements performed on a series of Co/Cu multilayers, sputter deposited onto etched silicon, reveal no variation in the interface roughness with etching voltage, the thickness of the individual layers also remaining constant. The observed decrease in the GMR cannot, therefore, be attributed to variations in spacer thickness or interfacial spin-independent scattering. Electron and X-ray Diffraction measurements suggest the reduction in GMR is due to a loss of antiferromagnetic coupling associated with a transformation of the texture from a randomly oriented to well oriented (111) polycrystalline texture, and subsequent reduction in the volume fraction of (100) oriented grains. Interfaces within Co/Cu are found to propagate with a high degree of conformality with increasing bilayer number, with an out-of-plane correlation length well in excess of 300A. In contrast, the Co/Pt system exhibits a limiting out-of-plane correlation length of the order of 350A arising from a columnar growth mode. X-ray Reflectivity and Diffraction measurements provide' no structural interpretation for the 3-fold enhancement in the rate of increase of the saturation conductivity, as a function of spacer thickness, in Fe/Au (100) compared to Fe/Au (111), or why large oscillations in the GMR occur for the (100) orientation only. Such observations are, however, consistent with the existence of a channelling mechanism in Fe/Au (100). Grazing Incidence Fluorescence data indicates that Nb acts as a surfactant in Fe/Au (111) growth on sapphire. The influence of different

Resonant diffuse X-ray scattering from magnetic multilayers

International Nuclear Information System (INIS)

Spezzani, Carlo; Torelli, Piero; Delaunay, Renaud; Hague, C.F.; Petroff, Frederic; Scholl, Andreas; Gullikson, E.M.; Sacchi, Maurizio

2004-01-01

We have measured field-dependent resonant diffuse scattering from a magnetoresistive Co/Cu multilayer. We have observed that the magnetic domain size in zero field depends on the magnetic history of the sample. The results of the X-ray scattering analysis have been compared to PEEM images of the magnetic domains

Spectral tailoring of nanoscale EUV and soft x-ray multilayer optics

Science.gov (United States)

Huang, Qiushi; Medvedev, Viacheslav; van de Kruijs, Robbert; Yakshin, Andrey; Louis, Eric; Bijkerk, Fred

2017-03-01

Extreme ultraviolet and soft X-ray (XUV) multilayer optics have experienced significant development over the past few years, particularly on controlling the spectral characteristics of light for advanced applications like EUV photolithography, space observation, and accelerator- or lab-based XUV experiments. Both planar and three dimensional multilayer structures have been developed to tailor the spectral response in a wide wavelength range. For the planar multilayer optics, different layered schemes are explored. Stacks of periodic multilayers and capping layers are demonstrated to achieve multi-channel reflection or suppression of the reflective properties. Aperiodic multilayer structures enable broadband reflection both in angles and wavelengths, with the possibility of polarization control. The broad wavelength band multilayer is also used to shape attosecond pulses for the study of ultrafast phenomena. Narrowband multilayer monochromators are delivered to bridge the resolution gap between crystals and regular multilayers. High spectral purity multilayers with innovated anti-reflection structures are shown to select spectrally clean XUV radiation from broadband X-ray sources, especially the plasma sources for EUV lithography. Significant progress is also made in the three dimensional multilayer optics, i.e., combining micro- and nanostructures with multilayers, in order to provide new freedom to tune the spectral response. Several kinds of multilayer gratings, including multilayer coated gratings, sliced multilayer gratings, and lamellar multilayer gratings are being pursued for high resolution and high efficiency XUV spectrometers/monochromators, with their advantages and disadvantages, respectively. Multilayer diffraction optics are also developed for spectral purity enhancement. New structures like gratings, zone plates, and pyramids that obtain full suppression of the unwanted radiation and high XUV reflectance are reviewed. Based on the present achievement

Analysis of an x-ray mirror made from piezoelectric bimorph

Science.gov (United States)

Zhang, Yao; Li, Ming; Tang, Shanzhi; Gao, Junxiang; Zhang, Weiwei; Zhu, Peiping

2017-07-01

Theoretical analysis of the mechanical behavior of an x-ray mirror made from piezoelectric bimorph is presented. A complete two-dimensional relationship between the radius of curvature of the mirror and the applied voltage is derived. The accuracy of this relationship is studied by comparing the figures calculated by the relationship and Finite Element Analysis. The influences of several critical parameters in the relationship on the radius of curvature are analyzed. It is found that piezoelectric coefficient d31 is the main material property parameter that dominates the radius of curvature, and that the optimal thickness of PZT plate corresponding to largest bending range is 2.5 times of that of faceplate. It is demonstrated that the relationship is helpful for us to complete the primary design of the x-ray mirror made from piezoelectric bimorph.

3D characterization of thin glass x-ray mirrors via optical profilometry

Science.gov (United States)

Civitani, M.; Ghigo, M.; Citterio, O.; Conconi, P.; Spiga, D.; Pareschi, G.; Proserpio, L.

2010-09-01

In this paper we present the "Characterization Universal Profilometer" (CUP), a new metrological instrument developed at the Brera Observatory for the 3D surface figure mapping of X-ray segmented mirrors. The CUP working principle is based on the measure of the the distance between the surface under test from a rigid reference dish. This approach is made possible by the coupled use of two sensors, the CHRocodile® optical device and the SIOS triple beam interferometer, mounted onto a proper system of x-y-z stage of translators. In this paper we describe the working principle of the new instrument. We will also present the results of the commissioning performed for a CUP breadboard developed at the Brera Observatory. The CUP offers the possibility to perform an high accuracy metrology of thin glass segments produced via hot slumping, to be used in future segmented X-ray mirrors like those foreseen aboard IXO or other projects that will make use of active X-ray mirrors.

X-ray supermirrors for BESSY II

International Nuclear Information System (INIS)

Erko, A.; Schaefers, F.; Vidal, B.; Yakshin, A.; Pietsch, U.; Mahler, W.

1995-01-01

X-ray multilayer supermirrors for the energy range up to 20 keV have been theoretically studied and experimentally measured with synchrotron radiation. A multilayer mirror with 50 W/Si bilayers with different thicknesses on the Si substrate has a smooth reflectivity of up to 32% in the whole energy range from 5 to 22 keV at a grazing incidence angle of 0.32 degree which is considerably larger than using total external reflection. copyright 1995 American Institute of Physics

X-ray telescope mirrors made of slumped glass sheets

Science.gov (United States)

Winter, A.; Breunig, E.; Friedrich, P.; Proserpio, L.

2017-11-01

For several decades, the field of X-ray astronomy has been playing a major role in understanding the processes in our universe. From binary stars and black holes up to galaxy clusters and dark matter, high energetic events have been observed and analysed using powerful X-ray telescopes like e.g. Rosat, Chandra, and XMM-Newton [1,2,3], giving us detailed and unprecedented views of the high-energy universe. In November 2013, the theme of "The Hot and Energetic Universe" was rated as of highest importance for future exploration and in June 2014 the ATHENA Advanced Telescope for High Energy Astrophysics was selected by ESA for the second large science mission (L2) in the ESA Cosmic Vision program, with launch foreseen in 2028 [4]. By combining a large X-ray telescope with state-of-the-art scientific instruments, ATHENA will address key questions in astrophysics, including: How and why does ordinary matter assemble into the galaxies and galactic clusters that we see today? How do black holes grow and influence their surroundings? In order to answer these questions, ATHENA needs a powerful mirror system which exceed the capabilities of current missions, especially in terms of collecting area. However, current technologies have reached the mass limits of the launching rocket, creating the need for more light-weight mirror systems in order to enhance the effective area without increasing the telescope mass. Hence new mirror technologies are being developed which aim for low-weight systems with large collecting areas. Light material like glass can be used, which are shaped to form an X-ray reflecting system via the method of thermal glass slumping.

Integration of the ATHENA mirror modules: development of indirect and x-ray direct AIT methods

Science.gov (United States)

Vernani, Dervis; Blum, Steffen; Seure, Thibault; Bavdaz, Marcos; Wille, Eric; Schaeffer, Uwe; Lièvre, Nicolas; Nazeeruddin, Adeeb; Barrière, Nicolas M.; Collon, Maximilien J.; Cibik, Levent; Krumrey, Michael; Müller, Peter; Burwitz, Vadim

2017-08-01

Within the ATHENA optics technology plan, activities are on-going for demonstrating the feasibility of the mirror module Assembly Integration and Testing (AIT). Each mirror module has to be accurately attached to the mirror structure by means of three isostatic mounts ensuring minimal distortion under environmental loads. This work reports on the status of one of the two parallel activities initiated by ESA to address this demanding task. In this study awarded to the industrial consortium, the integration relies on opto-mechanical metrology and direct X-ray alignment. For the first or "indirect" method the X-ray alignment results are accurately referenced, by means of a laser tracking system, to optical fiducial targets mounted on the mirror modules and finally linked to the mirror structure coordinate system. With the second or "direct" method the alignment is monitored in the X-ray domain, providing figures of merit directly comparable to the final performance. The integration being designed and here presented, foresees combining the indirect method to the X-ray direct method. The characterization of the single mirror modules is planned at PTB's X-ray Parallel Beam Facility (XPBF 2.0) at BESSY II, and the integration and testing campaign at Panter. It is foreseen to integrate and test a demonstrator with two real mirror modules manufactured by cosine.

Thin Films for X-ray Optics

Science.gov (United States)

Conley, Raymond

Focusing x-rays with refraction requires an entire array of lens instead of a single element, each contributing a minute amount of focusing to the system. In contrast to their visible light counterparts, diffractive optics require a certain depth along the optical axis in order to provide sufficient phase shift. Mirrors reflect only at very shallow angles. In order to increase the angle of incidence, contribution from constructive interference within many layers needs to be collected. This requires a multilayer coating. Thin films have become a central ingredient for many x-ray optics due to the ease of which material composition and thickness can be controlled. Chapter 1 starts with a short introduction and survey of the field of x-ray optics. This begins with an explanation of reflective multilayers. Focusing optics are presented next, including mirrors, zone plates, refractive lenses, and multilayer Laue lens (MLL). The strengths and weaknesses of each "species" of optic are briefly discussed, alongside fabrication issues and the ultimate performance for each. Practical considerations on the use of thin-films for x-ray optics fabrication span a wide array of topics including material systems selection and instrumentation design. Sputter deposition is utilized exclusively for the work included herein because this method of thin-film deposition allows a wide array of deposition parameters to be controlled. This chapter also includes a short description of two deposition systems I have designed. Chapter 2 covers a small sampling of some of my work on reflective multilayers, and outlines two of the deposition systems I have designed and built at the Advanced Photon Source. A three-stripe double multilayer monochromator is presented as a case study in order to detail specifications, fabrication, and performance of this prolific breed of x-ray optics. The APS Rotary Deposition System was the first deposition system in the world designed specifically for multilayer

Status and limitations of multilayer X-ray interference structures

International Nuclear Information System (INIS)

Kortright, J.B.

1996-01-01

Trends in the performance of x-ray multilayer interference structures with periods ranging from 9 to 130 (angstrom) are reviewed. Analysis of near-normal incidence reflectance data vs photon energy reveals that the effective interface with σ in a static Debye-Waller model, describing interdiffusion and roughness, decreases as the multilayer period decreases, and reaches a lower limit of roughly 2 (angstrom). Specular reflectance and diffuse scattering from uncoated and multilayer-coated substrates having different roughness suggest that this lower limit results largely from substrate roughness. The increase in interface width with period thus results from increasing roughness of interdiffusion as the layer thickness increases

EUV multilayer mirror, optical system including a multilayer mirror and method of manufacturing a multilayer mirror

NARCIS (Netherlands)

Huang, Qiushi; Louis, Eric; Bijkerk, Frederik; de Boer, Meint J.; von Blanckenhagen, G.

2016-01-01

A multilayer mirror (M) reflecting extreme ultraviolet (EUV) radiation from a first wave-length range in a EUV spectral region comprises a substrate (SUB) and a stack of layers (SL) on the substrate, the stack of layers comprising layers comprising a low index material and a high index material, the

X-ray beam-shaping via deformable mirrors: Analytical computation of the required mirror profile

International Nuclear Information System (INIS)

Spiga, Daniele; Raimondi, Lorenzo; Svetina, Cristian; Zangrando, Marco

2013-01-01

X-ray mirrors with high focusing performances are in use in both mirror modules for X-ray telescopes and in synchrotron and FEL (Free Electron Laser) beamlines. A degradation of the focus sharpness arises in general from geometrical deformations and surface roughness, the former usually described by geometrical optics and the latter by physical optics. In general, technological developments are aimed at a very tight focusing, which requires the mirror profile to comply with the nominal shape as much as possible and to keep the roughness at a negligible level. However, a deliberate deformation of the mirror can be made to endow the focus with a desired size and distribution, via piezo actuators as done at the EIS-TIMEX beamline of FERMI@Elettra. The resulting profile can be characterized with a Long Trace Profilometer and correlated with the expected optical quality via a wavefront propagation code. However, if the roughness contribution can be neglected, the computation can be performed via a ray-tracing routine, and, under opportune assumptions, the focal spot profile (the Point Spread Function, PSF) can even be predicted analytically. The advantage of this approach is that the analytical relation can be reversed; i.e., from the desired PSF the required mirror profile can be computed easily, thereby avoiding the use of complex and time-consuming numerical codes. The method can also be suited in the case of spatially inhomogeneous beam intensities, as commonly experienced at synchrotrons and FELs. In this work we expose the analytical method and the application to the beam shaping problem

Preface: The 5th International Workshop on X-ray Mirror Design, Fabrication, and Metrology

Energy Technology Data Exchange (ETDEWEB)

Assoufid, Lahsen [Argonne National Laboratory, 9700 South Cass Avenue, Lemont, Illinois 60439 (United States); Goldberg, Kenneth; Yashchuk, Valeriy V. [Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, California 94720 (United States)

2016-05-15

Recent developments in synchrotron storage rings and free-electron laser-based x-ray sources with ever-increasing brightness and coherent flux have pushed x-ray optics requirements to new frontiers. This Special Topic gathers a set of articles derived from a subset of the key presentations of the International Workshop on X-ray Mirrors Fabrication (IWXM-2015) and Metrology held at Lawrence Berkley National Laboratory, Berkeley, California, USA, July 14–16, 2015. The workshop objective was to report on recent progress in x-ray synchrotron radiation mirrors fabrication as well as on new developments in related metrology tools and methods.

X-ray propagation through a quasi-ordered multilayered structure ...

African Journals Online (AJOL)

We investigate the propagation of short wavelength transverse electric x-rays through a quasiordered (Fibonacci) atomically commensurate multilayered structure using a transfer matrix model which treats each atomic plane as a diffraction unit. The reflectance spectrum has a rich structure being dominated by peaks ...

GLASS AND SILICON FOILS FOR X-RAY SPACE TELESCOPE MIRRORS

Directory of Open Access Journals (Sweden)

M. MIKA

2011-12-01

Full Text Available Unique observations delivered by space X-ray imaging telescopes have been significantly contributing to important discoveries of current astrophysics. The telescopes’ most crucial part is a high throughput, heavily nested mirror array reflecting X-rays and focusing them to a detector. Future astronomical projects on large X-ray telescopes require novel materials and technologies for the construction of the reflecting mirrors. The future mirrors must be lightweight and precisely shaped to achieve large collecting area with high angular resolution of a few arc sec. The new materials and technologies must be cost-effective as well. Currently, the most promising materials are glass or silicon foils which are commercially produced on a large scale. A thermal forming process was used for the precise shaping of these foils. The forced and free slumping of the foils was studied in the temperature range of hot plastic deformation and the shapes obtained by the different slumping processes were compared. The shapes and the surface quality of the foils were measured by a Taylor Hobson contact profilemeter, a ZYGO interferometer and Atomic Forced Microscopy. In the experiments, both heat-treatment temperature and time were varied following our experiment design. The obtained data and relations can be used for modelling and optimizing the thermal forming procedure.

Design and characterization for absolute x-ray spectrometry in the 100-10,000 eV region

International Nuclear Information System (INIS)

Henke, B.L.

1986-08-01

Reviewed here are the design and characterization procedures used in our program for developing absolute x-ray spectrometry in the 100 to 10,000 eV region. Described are the selection and experimental calibration of the x-ray filters, mirror momochromators, crystal/multilayer analyzers, and the photographic (time integrating) and photoelectric (time resolving) position-sensitive detectors. Analytical response functions have been derived that characterize the energy dependence of the mirror and crystal/multilayer reflectivities and of the photographic film and photocathode sensitivities. These response functions permit rapid, small-computer reduction of the experimental spectra to absolute spectra (measured in photons per stearadian from the source for radiative transitions at indicated photon energies). Our x-ray spectrographic systems are being applied to the diagnostics of pulsed, high temperature plasma sources in laser fusion and x-ray laser research. 15 refs., 27 figs

Design and development of the SIMBOL-X hard x-ray optics

Science.gov (United States)

Pareschi, G.; Attinà, P.; Basso, S.; Borghi, G.; Burkert, W.; Buzzi, R.; Citterio, O.; Civitani, M.; Conconi, P.; Cotroneo, V.; Cusumano, G.; Dell'Orto, E.; Freyberg, M.; Hartner, G. D.; Gorenstein, P.; Mattaini, E.; Mazzoleni, F.; Parodi, G.; Romaine, S.; Spiga, D.; Tagliaferri, G.; Valtolina, R.; Valsecchi, G.; Vernani, D.

2008-07-01

The SIMBOL-X formation-flight X-ray mission will be operated by ASI and CNES in 2014, with a large participation of the French and Italian high energy astrophysics scientific community. Also German and US Institutions are contributing in the implementation of the scientific payload. Thanks to the formation-flight architecture, it will be possible to operate a long (20 m) focal length grazing incidence mirror module, formed by 100 confocal multilayer-coated Wolter I shells. This system will allow us to focus X-rays over a very broad energy band, from 0.5 keV up to 80 keV and beyond, with more than two orders of magnitude improvement in angular resolution (20 arcsec HEW) and sensitivity (0.5 µCrab on axis @30 keV) compared to non focusing detectors used so far. The X-ray mirrors will be realized by Ni electroforming replication, already successfully used for BeppoSAX, XMM-Newton, and JET-X/SWIFT; the thickness trend will be about two times less than for XMM, in order to save mass. Multilayer reflecting coatings will be implemented, in order to improve the reflectivity beyond 10 keV and to increase the field of view 812 arcmin at 30 keV). In this paper, the SIMBOL-X optics design, technology and implementation challenges will be discussed; it will be also reported on recent results obtained in the context of the SIMBOL-X optics development activities.

High Resolution Adjustable Mirror Control for X-ray Astronomy

Science.gov (United States)

Trolier-McKinstry, Susan

We propose to build and test thin film transistor control circuitry for a new highresolution adjustable X-ray mirror technology. This control circuitry will greatly simplify the wiring scheme to address individual actuator cells. The result will be a transformative improvement for the X-ray Surveyor mission concept: mathematical models, which fit the experimental data quite well, indicate that 0.5 arcsecond imaging is feasible through this technique utilizing thin slumped glass substrates with uncorrected angular resolution of order 5-10 arcseconds. In order to correct for figures errors in a telescope with several square meters of collecting area, millions of actuator cells must be set and held at specific voltages. It is clearly not feasible to do this via millions of wires, each one connected to an actuator. Instead, we propose to develop and test thin-film technology that operates on the same principle as megapixel computer screens. We will develop the technologies needed to build thin film piezoelectric actuators, controlled by thin film ZnO transistors, on flexible polyimide films, and to connect those films to the back surfaces of X-ray mirrors on thin glass substrates without deforming the surface. These technologies represent a promising avenue of the development of mirrors for the X-Ray Surveyor mission concept. Such a telescope will make possible detailed studies of a wide variety of astrophysical sources. One example is the Warm-Hot Intergalactic Medium (WHIM), which is thought to account for a large fraction of the normal matter in the universe but which has not been detected unambiguously to date. Another is the growth of supermassive black holes in the early universe. This proposal supports NASA's goals of technical advancement of technologies suitable for future missions, and training of graduate students.

Thin film and multilayer optics for XUV spectral domain (1 nm to 60 nm)

International Nuclear Information System (INIS)

Delmotte, Franck

2010-02-01

The XUV spectral domain (1-60 nm wavelength range) has experienced rapid growth in recent years. On one side, the sources (synchrotron radiation, harmonic generation, x-ray laser, free-electron laser...) require ever more efficient optics, on the other hand, applications (diagnostics of hot plasma, solar physics, x-ray microscopy, EUV lithography, x-ray analysis...) provide new constraints on the design of multilayer stacks. The multilayer mirrors are the only way to achieve efficient optics operating at non-grazing incidence angles in this spectral range. Our work within the team XUV Optics at Laboratoire Charles Fabry de l'Institut d'Optique focuses on the study of materials in thin layers correlated to the study of optical properties of multilayers. The objective is to achieve new multilayer components previously unavailable in the XUV domain, through a better understanding of physical phenomena in these nano-layer stacks. We show through several examples of how we have managed both to improve the performance of multilayer mirrors in a broad spectral range, and secondly, to develop new optical functions: beam splitters, broadband mirrors, dual-band mirrors or phase compensation mirrors. (author)

Long, elliptically bent, active X-ray mirrors with slope errors <200 nrad.

Science.gov (United States)

Nistea, Ioana T; Alcock, Simon G; Kristiansen, Paw; Young, Adam

2017-05-01

Actively bent X-ray mirrors are important components of many synchrotron and X-ray free-electron laser beamlines. A high-quality optical surface and good bending performance are essential to ensure that the X-ray beam is accurately focused. Two elliptically bent X-ray mirror systems from FMB Oxford were characterized in the optical metrology laboratory at Diamond Light Source. A comparison of Diamond-NOM slope profilometry and finite-element analysis is presented to investigate how the 900 mm-long mirrors sag under gravity, and how this deformation can be adequately compensated using a single, spring-loaded compensator. It is shown that two independent mechanical actuators can accurately bend the trapezoidal substrates to a range of elliptical profiles. State-of-the-art residual slope errors of <200 nrad r.m.s. are achieved over the entire elliptical bending range. High levels of bending repeatability (ΔR/R = 0.085% and 0.156% r.m.s. for the two bending directions) and stability over 24 h (ΔR/R = 0.07% r.m.s.) provide reliable beamline performance.

The MEL-X project at the Lawrence Livermore National Laboratory: a mirror-based delay line for x-rays

Science.gov (United States)

Pardini, Tom; Hill, Randy; Decker, Todd; Alameda, Jennifer; Soufli, Regina; Aquila, Andy; Guillet, Serge; Boutet, Sébastien; Hau-Riege, Stefan P.

2015-09-01

At the Lawrence Livermore National Laboratory (LLNL) in collaboration with the Linac Coherent Light Source (LCLS) we are developing a mirror-based delay line for x-rays (MEL-X) to enable x-ray pump/x-ray probe experiments at Free Electron Lasers (XFELs). The goal of this project is the development and deployment of a proof-of-principle delay line featuring coated x-ray optics. The four-mirror design of the MEL-X is motivated by the need for ease of alignment and use. In order to simplify the overlap of the pump and the probe beam after each delay time change, a scheme involving super-polished rails and mirror-to-motor decoupling has been adopted. The MEL-X, used in combination with a bright pulsed source like LCLS, features a capability for a high intensity pump beam. Its Iridium coating allows it to work at hard x-ray energies all the way up to 9 keV, with a probe beam transmission of 35% up to 8keV, and 14% at 9keV. The delay time can be tailored to each particular experiment, with a nominal range of 70 - 350 fs for this prototype. The MEL-X, combined with established techniques such as x-ray diffraction, absorption or emission, could provide new insights on ultra-fast transitions in highly excited states of matter.

Figure tolerance of a Wolter type I mirror for a soft-x-ray microscope

International Nuclear Information System (INIS)

Chon, Kwon Su; Namba, Yoshiharu; Yoon, Kwon-Ha

2007-01-01

The demand for an x-ray microscope has received much attention because of the desire to study living cells at a high resolution and in a hydrated environment. A Wolter type I mirror used for soft-x-ray microscope optics has many advantages. From the mirror fabrication point of view, it is necessary to perform tolerance analysis, particularly with respect to figure errors that considerably degrade the image quality.The figure tolerance of a Wolter type I mirror for a biological application in terms of the image quality and the state-of-the-art fabrication technology is discussed. The figure errors rapidly destroyed the image quality, and the required slope error depended on the detector used in the soft-x-ray microscope

A Soft X-ray Spectrometer using a Highly Dispersive Multilayer Grating

International Nuclear Information System (INIS)

Warwick, Tony; Padmore, Howard; Voronov, Dmitriy; Yashchuk, Valeriy

2010-01-01

There is a need for higher resolution spectrometers as a tool for inelastic x-ray scattering. Currently, resolving power around R = 10,000 is advertised. Measured RIXS spectra are often limited by this instrumental resolution and higher resolution spectrometers using conventional gratings would be prohibitively large. We are engaged in a development program to build blazed multilayer grating structures for diffracting soft x-rays in high order. This leads to spectrometers with dispersion much higher than is possible using metal coated-gratings. The higher dispersion then provides higher resolution and the multilayer gratings are capable of operating away from grazing incidence as required. A spectrometer design is presented with a total length 3.8 m and capable of 10 5 resolving power.

A Soft X-ray Spectrometer using a Highly Dispersive Multilayer Grating

International Nuclear Information System (INIS)

Warwick, Tony; Padmore, Howard; Voronov, Dmitriy; Yashchuk, Valeriy

2010-01-01

There is a need for higher resolution spectrometers as a tool for inelastic x-ray scattering. Currently, resolving power around R = 10,000 is advertised. Measured RIXS spectra are often limited by this instrumental resolution and higher resolution spectrometers using conventional gratings would be prohibitively large. We are engaged in a development program to build blazed multilayer grating structures for diffracting soft x-rays in high order. This leads to spectrometers with dispersion much higher than is possible using metal coated-gratings. The higher dispersion then provides higher resolution and the multilayer gratings are capable of operating away from grazing incidence as required. A spectrometer design is presented with a total length 3.8m and capable of 10 5 resolving power.

Simbol-X Mirror Module Thermal Shields: I-Design and X-Ray Transmission

Science.gov (United States)

Collura, A.; Barbera, M.; Varisco, S.; Basso, S.; Pareschi, G.; Tagliaferri, G.; Ayers, T.

2009-05-01

The Simbol-X mission is designed to fly in formation flight configuration. As a consequence, the telescope has both ends open to space, and thermal shielding at telescope entrance and exit is required to maintain temperature uniformity throughout the mirrors. Both mesh and meshless solutions are presently under study for the shields. We discuss the design and the X-ray transmission.

Simbol-X Mirror Module Thermal Shields: I - Design and X-Ray Transmission

International Nuclear Information System (INIS)

Collura, A.; Varisco, S.; Barbera, M.; Basso, S.; Pareschi, G.; Tagliaferri, G.; Ayers, T.

2009-01-01

The Simbol-X mission is designed to fly in formation flight configuration. As a consequence, the telescope has both ends open to space, and thermal shielding at telescope entrance and exit is required to maintain temperature uniformity throughout the mirrors. Both mesh and meshless solutions are presently under study for the shields. We discuss the design and the X-ray transmission.

Characterization of a next-generation piezo bimorph X-ray mirror for synchrotron beamlines

Energy Technology Data Exchange (ETDEWEB)

Alcock, Simon G., E-mail: simon.alcock@diamond.ac.uk; Nistea, Ioana; Sutter, John P.; Sawhney, Kawal [Diamond Light Source, Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE (United Kingdom); Fermé, Jean-Jacques; Thellièr, Christophe; Peverini, Luca [Thales-SESO, 305 rue Louis Armand, Pôle d’Activités d’Aix les Milles, Aix-en-Provence (France)

2015-01-01

A next-generation bimorph mirror with piezos bonded to the side faces of a monolithic substrate was created. When replacing a first-generation bimorph mirror suffering from the junction effect, the new type of mirror significantly improved the size and shape of the reflected synchrotron X-ray beam. No evidence of the junction effect was observed even after eight months of continuous beamline usage. Piezo bimorph mirrors are versatile active optics used on many synchrotron beamlines. However, many bimorphs suffer from the ‘junction effect’: a periodic deformation of the optical surface which causes major aberrations to the reflected X-ray beam. This effect is linked to the construction of such mirrors, where piezo ceramics are glued directly below the thin optical substrate. In order to address this problem, a next-generation bimorph with piezos bonded to the side faces of a monolithic substrate was developed at Thales-SESO and optimized at Diamond Light Source. Using metrology feedback from the Diamond-NOM, the optical slope error was reduced to ∼0.5 µrad r.m.s. for a range of ellipses. To maximize usability, a novel holder was built to accommodate the substrate in any orientation. When replacing a first-generation bimorph on a synchrotron beamline, the new mirror significantly improved the size and shape of the reflected X-ray beam. Most importantly, there was no evidence of the junction effect even after eight months of continuous beamline usage. It is hoped that this new design will reinvigorate the use of active bimorph optics at synchrotron and free-electron laser facilities to manipulate and correct X-ray wavefronts.

Characterization of a next-generation piezo bimorph X-ray mirror for synchrotron beamlines

International Nuclear Information System (INIS)

Alcock, Simon G.; Nistea, Ioana; Sutter, John P.; Sawhney, Kawal; Fermé, Jean-Jacques; Thellièr, Christophe; Peverini, Luca

2015-01-01

A next-generation bimorph mirror with piezos bonded to the side faces of a monolithic substrate was created. When replacing a first-generation bimorph mirror suffering from the junction effect, the new type of mirror significantly improved the size and shape of the reflected synchrotron X-ray beam. No evidence of the junction effect was observed even after eight months of continuous beamline usage. Piezo bimorph mirrors are versatile active optics used on many synchrotron beamlines. However, many bimorphs suffer from the ‘junction effect’: a periodic deformation of the optical surface which causes major aberrations to the reflected X-ray beam. This effect is linked to the construction of such mirrors, where piezo ceramics are glued directly below the thin optical substrate. In order to address this problem, a next-generation bimorph with piezos bonded to the side faces of a monolithic substrate was developed at Thales-SESO and optimized at Diamond Light Source. Using metrology feedback from the Diamond-NOM, the optical slope error was reduced to ∼0.5 µrad r.m.s. for a range of ellipses. To maximize usability, a novel holder was built to accommodate the substrate in any orientation. When replacing a first-generation bimorph on a synchrotron beamline, the new mirror significantly improved the size and shape of the reflected X-ray beam. Most importantly, there was no evidence of the junction effect even after eight months of continuous beamline usage. It is hoped that this new design will reinvigorate the use of active bimorph optics at synchrotron and free-electron laser facilities to manipulate and correct X-ray wavefronts

Multilayer mirror and foil filter AXUV diode arrays on CDX-U spherical torus

International Nuclear Information System (INIS)

Soukhanovskii, V. A.; Stutman, D.; Iovea, M.; Finkenthal, M.; Moos, H. W.; Munsat, T.; Jones, B.; Hoffman, D.; Kaita, R.; Majeski, R.

2001-01-01

Recent upgrades to CDX-U spherical torus diagnostics include two 10-channel AXUV diode arrays. The multilayer mirror (MLM) array measures the λ150 O VI brightness profile in the poloidal plane using the Mo/B 4 C synthetic multilayer structures as dispersive elements. The foil filter array has a tangential view and is equipped with interchangeable clear aperture, beryllium and titanium filters. This allows measurements of radiated power, O VI or C V radial distributions, respectively. The O VI and C V emissivity and the radiated power profiles are highly peaked. A Neoclassical impurity accumulation mechanism is considered as an explanation. For radiated power measurements in the T e ≤100 eV plasmas, photon energy dependent corrections must be used in order to account for nonlinear AXUV sensitivity in the range E phot ≤20 eV. The arrays are also used for characterization of resistive MHD phenomena, such as the low m modes, saw-tooth oscillations and internal reconnection events. Based on the successful operation of the diagnostics, a new ultra soft x-ray multilayer mirror diode AXUV diode array monitoring the 34 Aa emissivity distribution of C VI will be built and installed on the National Spherical Torus Experiment

Speckle-based portable device for in-situ metrology of x-ray mirrors at Diamond Light Source

Science.gov (United States)

Wang, Hongchang; Kashyap, Yogesh; Zhou, Tunhe; Sawhney, Kawal

2017-09-01

For modern synchrotron light sources, the push toward diffraction-limited and coherence-preserved beams demands accurate metrology on X-ray optics. Moreover, it is important to perform in-situ characterization and optimization of X-ray mirrors since their ultimate performance is critically dependent on the working conditions. Therefore, it is highly desirable to develop a portable metrology device, which can be easily implemented on a range of beamlines for in-situ metrology. An X-ray speckle-based portable device for in-situ metrology of synchrotron X-ray mirrors has been developed at Diamond Light Source. Ultra-high angular sensitivity is achieved by scanning the speckle generator in the X-ray beam. In addition to the compact setup and ease of implementation, a user-friendly graphical user interface has been developed to ensure that characterization and alignment of X-ray mirrors is simple and fast. The functionality and feasibility of this device is presented with representative examples.

ALD Sapphire Coating for Large Area Soft X-ray Mirrors

Data.gov (United States)

National Aeronautics and Space Administration — This proposed work is to demonstrate that the already established ALD coating method can be applied to the X-ray mirror fabrication and is suitable to produce an...

U and Pu Gamma-Ray Measurements of Spent Fuel Using a Gamma-Ray Mirror Band-Pass Filter

International Nuclear Information System (INIS)

Ziock, K.-P.; Kisner, R.; Melin, A.; Patton, B.; Alameda, J.; Brejnhold, N.; Decker, T.; Descalle, M.-A.; Fernandez-Perea, M.; Hill, R.; Ruz Armendariz, J.; Soufli, R.

2015-01-01

We report the use of grazing incidence gamma-ray mirrors as narrow band-pass filters for advanced non-destructive analysis of spent nuclear fuel. The mirrors limit radiation reaching an HPGe detector to narrow spectral bands around characteristic emission lines from fissile isotopes in the fuel. Ideally, these emissions could be used to determine the fuel's fissile content, but they are normally masked by the overwhelming radiation emitted by short-lived fission by-products. These latter emissions raise the overall background, making direct observation of the fuel with HPGe detectors virtually impossible. Such observations can only be performed using precise collimators that restrict the detector's field of view to very small solid angles. This results in impracticably long dwell times for safeguards measurements targeting the weak isotopic lines of interest. In a proof-ofconcept experiment, a set of simple flat gamma-ray mirrors was used to observe the atomic florescence lines from U and Pu from a spent nuclear fuel pin. For the measurements, the mirrors were placed at the egress of an access port in a hot cell wall. A coarse collimator in the port restricted radiation from a fuel pin placed in front of the port to fully illuminate the front surface of the mirror assembly (0:5 x 3:8 cm2). The mirrors, consisting of highly polished silicon substrates deposited with WC/SiC multilayer coatings, were successfully used to deflect the lines of interest onto an HPGe detector while the intense primary radiation from the spent fuel was blocked by a lead beam stop. The gamma-ray mirror multilayer coatings used here at ∼100 keV, have been experimentally tested at energies as high as 645 keV, indicating that direct observation of nuclear emission lines from 239Pu should be possible with an appropriately designed optic. (author)

Two-dimensional in situ metrology of X-ray mirrors using the speckle scanning technique

Energy Technology Data Exchange (ETDEWEB)

Wang, Hongchang, E-mail: hongchang.wang@diamond.ac.uk; Kashyap, Yogesh; Laundy, David; Sawhney, Kawal [Diamond Light Source Ltd, Harwell Science and Innovation Campus, Didcot OX11 0DE (United Kingdom)

2015-06-06

The two-dimensional slope error of an X-ray mirror has been retrieved by employing the speckle scanning technique, which will be valuable at synchrotron radiation facilities and in astronomical telescopes. In situ metrology overcomes many of the limitations of existing metrology techniques and is capable of exceeding the performance of present-day optics. A novel technique for precisely characterizing an X-ray bimorph mirror and deducing its two-dimensional (2D) slope error map is presented. This technique has also been used to perform fast optimization of a bimorph mirror using the derived 2D piezo response functions. The measured focused beam size was significantly reduced after the optimization, and the slope error map was then verified by using geometrical optics to simulate the focused beam profile. This proposed technique is expected to be valuable for in situ metrology of X-ray mirrors at synchrotron radiation facilities and in astronomical telescopes.

Adjustment of a low energy, X-rays generator (6 kV - 50 mA). Application to X-rays detectors calibration

International Nuclear Information System (INIS)

Legistre, C.

1995-02-01

The aim of this memoir is the calibration of an aluminium photocathode X-rays photoelectric detector, in the spectral range 0,5 keV - 1,5 KeV, with a continuous X-ray source. The detectors's calibration consist to measure the detector's sensitivity versus incident energy. In order to produce monochromatic incident beam on the detector, we used a multilayer mirror whose reflectivity was characterized. The measurements are compared to those realized in an other laboratory. (authors). 36 refs., 61 figs., 13 tabs., 2 photos

A compressed sensing X-ray camera with a multilayer architecture

Science.gov (United States)

Wang, Zhehui; Iaroshenko, O.; Li, S.; Liu, T.; Parab, N.; Chen, W. W.; Chu, P.; Kenyon, G. T.; Lipton, R.; Sun, K.-X.

2018-01-01

Recent advances in compressed sensing theory and algorithms offer new possibilities for high-speed X-ray camera design. In many CMOS cameras, each pixel has an independent on-board circuit that includes an amplifier, noise rejection, signal shaper, an analog-to-digital converter (ADC), and optional in-pixel storage. When X-ray images are sparse, i.e., when one of the following cases is true: (a.) The number of pixels with true X-ray hits is much smaller than the total number of pixels; (b.) The X-ray information is redundant; or (c.) Some prior knowledge about the X-ray images exists, sparse sampling may be allowed. Here we first illustrate the feasibility of random on-board pixel sampling (ROPS) using an existing set of X-ray images, followed by a discussion about signal to noise as a function of pixel size. Next, we describe a possible circuit architecture to achieve random pixel access and in-pixel storage. The combination of a multilayer architecture, sparse on-chip sampling, and computational image techniques, is expected to facilitate the development and applications of high-speed X-ray camera technology.

X-ray mirror development and testing for the ATHENA mission

Science.gov (United States)

Della Monica Ferreira, Desiree; Jakobsen, Anders C.; Massahi, Sonny; Christensen, Finn E.; Shortt, Brian; Garnæs, Jørgen; Torras-Rosell, Antoni; Krumrey, Michael; Cibik, Levent; Marggraf, Stefanie

2016-07-01

This study reports development and testing of coatings on silicon pore optics (SPO) substrates including pre and post coating characterisation of the x-ray mirrors using Atomic Force Microscopy (AFM) and X-ray reflectometry (XRR) performed at the 8 keV X-ray facility at DTU Space and with synchrotron radiation in the laboratory of PTB at BESSY II. We report our findings on surface roughness and coating reflectivity of Ir/B4C coatings considering the grazing incidence angles and energies of ATHENA and long term stability of Ir/B4C, Pt/B4C, W/Si and W/B4C coatings.

Study of interface correlation in W/C multilayer structure by specular and non-specular grazing incidence X-ray reflectivity measurements

Energy Technology Data Exchange (ETDEWEB)

Biswas, A., E-mail: arupb@barc.gov.in; Bhattacharyya, D.; Sahoo, N. K. [Atomic and Molecular Physics Division, Bhabha Atomic Research Centre, Mumbai 400085 (India); Maidul Haque, S.; Tripathi, S.; De, Rajnarayan [Atomic and Molecular Physics Division, Bhabha Atomic Research Centre, VIZAG Centre, Visakhapatnam 530012 (India); Rai, S. [Indus Synchrotron Utilization Division, Raja Raman Centre for Advanced Technology, Indore 452013 (India)

2015-10-28

W/C/W tri-layer thin film samples have been deposited on c-Si substrates in a home-built Ion Beam Sputtering system at 1.5 × 10{sup −3} Torr Ar working pressure and 10 mA grid current. The tri-layer samples have been deposited at different Ar{sup +} ion energies between 0.6 and 1.2 keV for W layer deposition and the samples have been characterized by specular and non-specular grazing incidence X-ray reflectivity (GIXR) measurements. By analyzing the GIXR spectra, various interface parameters have been obtained for both W-on-C and C-on-W interfaces and optimum Ar{sup +} ion energy for obtaining interfaces with low imperfections has been found. Subsequently, multilayer W/C samples with 5-layer, 7-layer, 9-layer, and 13-layer have been deposited at this optimum Ar{sup +} ion energy. By fitting the specular and diffused GIXR data of the multilayer samples with the parameters of each interface as fitting variables, different interface parameters, viz., interface width, in-plane correlation length, interface roughness, and interface diffusion have been estimated for each interface and their variation across the depth of the multilayers have been obtained. The information would be useful in realizing W/C multilayers for soft X-ray mirror application in the <100 Å wavelength regime. The applicability of the “restart of the growth at the interface” model in the case of these ion beam sputter deposited W/C multilayers has also been investigated in the course of this study.

Dispersive x-ray synchrotron studies of Pt-C multilayers

International Nuclear Information System (INIS)

Smither, R.K.; Rodricks, B.; Lamelas, F.; Medjahed, D.; Dos Passos, W.; Clarke, R.; Ziegler, E.; Fontaine, A.

1989-02-01

We demonstrate the simultaneous acquisition of high-resolution x-ray absorption spectra and scattering data, using a combination of energy-dispersive optics and a two-dimensional CCD detector. Results are presented on the optical constants of Pt and on the reflectivity of a platinum-carbon multilayer at the L/sub III/ absorption edge of Pt. 12 refs., 5 figs

X-ray diffuse scattering effects from Coulomb-type defects in multilayered structures

International Nuclear Information System (INIS)

Olikhovskii, S.I.; Molodkin, V.B.; Skakunova, E.S.; Kislovskii, E.N.; Fodchuk, I.M.

2009-01-01

The theoretical X-ray diffraction model starting from Takagi-Taupin equation has been developed for the description of coherent and diffuse components of the rocking curve (RC) measured from the multilayered crystal structure with randomly distributed Coulomb-type defects in all the layers and substrate. The model describes both diffuse scattering (DS) intensity distribution and influence of DS on attenuation and angular redistribution of the coherent X-ray scattering intensity. By analyzing the total measured RC with using the proposed diffraction model, the chemical compositions, strains, and characteristics of dislocation loops in layers and substrate of the multilayered structure with InGaAsN/GaAs single quantum well have been determined. (Abstract Copyright [2009], Wiley Periodicals, Inc.)

Ultra-short-period W/B₄C multilayers for x-ray optics-microstructure limits on reflectivity

Energy Technology Data Exchange (ETDEWEB)

Walton, Christopher Charles [Univ. of California, Berkeley, CA (United States). Dept. of Materials Science and Mineral Engineering

1997-12-01

Multilayer thin films are used as Bragg reflectors for soft x-rays in the energy range 50eV < E < 1000eV in many x-ray optics applications such as x-ray microscopes and telescopes, reducing optics for extreme ultraviolet (EUV) lithography, and x-ray polarizers and phase retarders. Applications often depend critically on reflectivity, which has not been systematically characterized for multilayer periods below 20Å. For this study, W/B₄C multilayers were fabricated by magnetron sputtering on Si(111), with periods from 48Å to as little as 4.7Å. The x-ray reflectivity measured at λ = 1.54Å and at 45° incidence (289 eV < E < 860 eV) was found to decrease sharply for multilayer periods less than 15-20Å. Examination by high-resolution transmission electron microscopy (HRTEM) showed an expansion of the thickness of the W-rich layers of 30-40% from the nominal values, consistent with intermixture of the two materials during sputter growth, and discontinuous W-rich layers for multilayer periods below about 15Å. The experimental data for the specular reflectivity in the hard and soft x-ray regimes and the diffuse scattering fit well to a model of multilayer roughness. The model is expressed as a power-law dependence of roughness on spatial frequency. Analysis of small-angle scattering in transmission from multilayers grown on freestanding Si₃N₄ membranes confirms the onset of discontinuity at periods between 14Å and 22Å. Spectroscopy studies by x-ray absorption (NEXAFS) and electron energy loss (EELS) at the boron K-edge (188eV) are consistent with changes in the average boron bonding environment, as the multilayer period decreases and the W-rich layers are increasingly thin and dispersed. A discrete W-rich phase is present for periods at least as small as 6.3Å.

Status of Mirror Development for the Marshall Grazing Incidence X-ray Spectrometer (MaGIXS)

Science.gov (United States)

Champey, P. R.; Winebarger, A. R.; Kobayashi, K.; Savage, S. L.; Ramsey, B.; Kolodziejczak, J.; Speegle, C.; Young, M.; Kester, T.; Cheimets, P.; Hertz, E.

2017-12-01

The Marshall Grazing Incidence X-ray Spectrometer (MaGIXS) is a NASA sounding rocket instrument designed to observe soft X-ray emissions at 0.5 - 2.0 keV energies (24 - 6 Å) from a solar active region. MaGIXS will, for the first time, obtain spatially resolved spectra of high-temperature, low-emission plasma within an active region core. The unique optical design includes a Wolter I telescope and a 3-optic grazing incidence spectrograph. The spectrograph consists of a finite conjugate, stigmatic mirror pair and a planar varied line space grating. The grazing incidence mirrors are being developed at NASA Marshall Space Flight Center (MSFC) and are produced using electroform nickel-replication techniques, employing the same facilities developed for HERO, FOXSI, ART-XC and IXPE. The MaGIXS mirror mandrels have been fabricated, figured, and have completed the first phase of polishing. A set of three test shells were replicated and exposed to X-rays in the Stray Light Facility (SLF) at MSFC. Here we present results from mandrel metrology and X-ray testing at the SLF. We also discuss the development of a new polishing technique for the MaGIXS mirror mandrels, where we plan to use the Zeeko polishing machine.

Multilayer coating facility for the HEFT hard x-ray telescope

DEFF Research Database (Denmark)

Cooper-Jensen, Carsten P.; Christensen, Finn Erland; Chen, Hubert

2001-01-01

A planar magnetron sputtering facility has been established at the Danish Space Research Institute (DSRI) for the production coating of depth graded multilayers on the thermally slumped glass segments which form the basis for the hard X-ray telescope on the HEFT balloon project. The facility...

An approach to the theory of X-ray multilayers with graded period

CERN Document Server

Vinogradov, A V

2000-01-01

A wide bandpass for multilayer mirrors can be obtained by gradually changing their period. In this paper the theory of such optical elements is developed on the basis of the general theory of wave propagation through layered medium. The results of reflectivity calculation for broadband mirrors are presented. The suggested theory is a natural step to the inverse problem - design of multilayers with the required wavelength dependence of reflectivity.

The eROSITA X-ray mirrors: technology and qualification aspects of the production of mandrels, shells and mirror modules

Science.gov (United States)

Arcangeli, L.; Borghi, G.; Bräuninger, H.; Citterio, O.; Ferrario, I.; Friedrich, P.; Grisoni, G.; Marioni, F.; Predehl, P.; Rossi, M.; Ritucci, A.; Valsecchi, G.; Vernani, D.

2017-11-01

The name "eROSITA" stands for extended Roentgen Survey with an Imaging Telescope Array. The general design of the eROSITA X-ray telescope is derived from that of ABRIXAS. A bundle of 7 mirror modules with short focal lengths make up a compact telescope which is ideal for survey observations. Similar designs had been proposed for the missions DUO and ROSITA but were not realized due to programmatic shortfall. Compared to those, however, the effective area in the soft X-ray band has now much increased by adding 27 additional outer mirror shells to the original 27 ones of each mirror module. The requirement on the on-axis resolution has also been confined, namely to 15 arc seconds HEW. For these reasons the prefix "extended" was added to the original name "ROSITA". The scientific motivation for this extension is founded in the ambitious goal to detect about 100,000 clusters of galaxies which trace the large scale structure of the Universe in space and time. The X-ray telescope of eROSITA will consist of 7 identical and co-aligned mirror modules, each with 54 nested Wolter-1 mirror shells. The mirror shells are glued onto a spider wheel which is screwed to the mirror interface structure making a rigid mechanical unit. The assembly of 7 modules forms a compact hexagonal configuration with 1300 mm diameter (see Fig. 1) and will be attached to the telescope structure which connects to the 7 separate CCD cameras in the focal planes. The co-alignment of the mirror module enables eROSITA to perform also pointed observations. The replication process described in chapter III allows the manufacturing in one single piece and at the same time of both the parabola and hyperbola parts of the Wolter 1 mirror.

Spectroscopic characterization of novel multilayer mirrors intended for astronomical and laboratory applications

Science.gov (United States)

Ragozin, Eugene N.; Mednikov, Konstantin N.; Pertsov, Andrei A.; Pirozhkov, Alexander S.; Reva, Anton A.; Shestov, Sergei V.; Ul'yanov, Artem S.; Vishnyakov, Eugene A.

2009-05-01

We report measurements of the reflection spectra of (i) concave (spherical and parabolic) Mo/Si, Mg/Si, and Al/Zr multilayer mirrors (MMs) intended for imaging solar spectroscopy in the framework of the TESIS/CORONAS-FOTON Satellite Project and of (ii) an aperiodic Mo/Si MM optimized for maximum uniform reflectivity in the 125-250 Å range intended for laboratory applications. The reflection spectra were measured in the configuration of a transmission grating spectrometer employing the radiation of a tungsten laser-driven plasma as the source. The function of detectors was fulfilled by backside-illuminated CCDs coated with Al or Zr/Si multilayer absorption filters. High-intensity second-order interference reflection peaks at wavelengths of about 160 Å were revealed in the reflection spectra of the 304-Å Mo/Si MMs. By contrast, the second-order reflection peak in the spectra of the new-generation narrow-band (~12 Å FWHM) 304-Å Mg/Si MMs is substantially depressed. Manifestations of the NEXAFS structure of the L2, 3 absorption edges of Al and Al2O3 were observed in the spectra recorded. The broadband Mo/Si MM was employed as the focusing element of spectrometers in experiments involving (i) the charge exchange of multiply charged ions with the donor atoms of a rare-gas jet; (ii) the spectroscopic characterization of a debris-free soft X-ray radiation source excited by Nd laser pulses in a Xe jet (iii) near-IR-to-soft-X-ray frequency conversion (double Doppler effect) occurring in the retroreflection from the relativistic electron plasma wake wave (flying mirror) driven by a multiterawatt laser in a pulsed helium jet.

Characterization of a confocal three-dimensional micro X-ray fluorescence facility based on polycapillary X-ray optics and Kirkpatrick-Baez mirrors

International Nuclear Information System (INIS)

Sun Tianxi; Ding Xunliang; Liu Zhiguo; Zhu Guanghua; Li Yude; Wei Xiangjun; Chen Dongliang; Xu Qing; Liu Quanru; Huang Yuying; Lin Xiaoyan; Sun Hongbo

2008-01-01

A new confocal three-dimensional micro X-ray fluorescence (3D micro-XRF) facility based on polycapillary X-ray optics in the detection channel and Kirkpatrick-Baez (KB) mirrors in the excitation channel is designed. The lateral resolution (l x , l y ) of this confocal three-dimensional micro-X-ray fluorescence facility is 76.3(l x ) and 53.4(l y ) μm respectively, and its depth resolution d z is 77.1 μm at θ = 90 o . A plant sample (twig of B. microphylla) and airborne particles are analyzed

Spectral tailoring of nanoscale EUV and soft x-ray multilayer optics

NARCIS (Netherlands)

Huang, Qiushi; Medvedev, Viacheslav; van de Kruijs, Robbert Wilhelmus Elisabeth; Yakshin, Andrey; Louis, Eric; Bijkerk, Frederik

2017-01-01

Extreme ultraviolet and soft X-ray (XUV) multilayer optics have experienced significant development over the past few years, particularly on controlling the spectral characteristics of light for advanced applications like EUV photolithography, space observation, and accelerator- or lab-based XUV

EUV multilayer mirrors with enhanced stability

Science.gov (United States)

Benoit, Nicolas; Yulin, Sergiy; Feigl, Torsten; Kaiser, Norbert

2006-08-01

The application of multilayer optics in EUV lithography requires not only the highest possible normal-incidence reflectivity but also a long-term thermal and radiation stability at operating temperatures. This requirement is most important in the case of the collector mirror of the illumination system close to the EUV source where a short-time decrease in reflectivity is most likely. Mo/Si multilayer mirrors, designed for high normal reflectivity at the wavelength of 13.5 nm and deposited by dc magnetron sputtering, were directly exposed to EUV radiation without mitigation system. They presented a loss of reflectivity of more than 18% after only 8 hours of irradiation by a Xe-discharge source. Another problem of Mo/Si multilayers is the instability of reflectivity and peak wavelength under high heat load. It becomes especially critical at temperatures above 200°C, where interdiffusion between the molybdenum and the silicon layers is observed. The development of high-temperature multilayers was focused on two alternative Si-based systems: MoSi II/Si and interface engineered Mo/C/Si/C multilayer mirrors. The multilayer designs as well as the deposition parameters of all systems were optimized in terms of high peak reflectivity (>= 60 %) at a wavelength of 13.5 nm and high thermal stability. Small thermally induced changes of the MoSi II/Si multilayer properties were found but they were independent of the annealing time at all temperatures examined. A wavelength shift of -1.7% and a reflectivity drop of 1.0% have been found after annealing at 500°C for 100 hours. The total degradation of optical properties above 650°C can be explained by a recrystallization process of MoSi II layers.

Development and production of hard X-ray multilayer optics for HEFT

DEFF Research Database (Denmark)

Koglin, J.E; Christensen, Finn Erland; Chonko, J.

2002-01-01

approximation Wolter-I design. The segmented mirrors that form these layers are made of thermally formed glass substrates coated with depth-graded multilayer films for enhanced reflectivity. The mirrors are assembled using an over-constraint method that forces the overall shape of the nominally cylindrical...

X-ray metrology and performance of a 45-cm long x-ray deformable mirror

Energy Technology Data Exchange (ETDEWEB)

Poyneer, Lisa A., E-mail: poyneer1@llnl.gov; Brejnholt, Nicolai F.; Hill, Randall; Jackson, Jessie; Hagler, Lisle [Lawrence Livermore National Laboratory, 7000 East Avenue, Livermore, California 94550 (United States); Celestre, Richard; Feng, Jun [Advanced Light Source, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, California 94720 (United States)

2016-05-15

We describe experiments with a 45-cm long x-ray deformable mirror (XDM) that have been conducted in End Station 2, Beamline 5.3.1 at the Advanced Light Source. A detailed description of the hardware implementation is provided. We explain our one-dimensional Fresnel propagation code that correctly handles grazing incidence and includes a model of the XDM. This code is used to simulate and verify experimental results. Initial long trace profiler metrology of the XDM at 7.5 keV is presented. The ability to measure a large (150-nm amplitude) height change on the XDM is demonstrated. The results agree well with the simulated experiment at an error level of 1 μrad RMS. Direct imaging of the x-ray beam also shows the expected change in intensity profile at the detector.

Design of an imaging microscope for soft X-ray applications

Science.gov (United States)

Hoover, Richard B.; Shealy, David L.; Gabardi, David R.; Walker, Arthur B. C., Jr.; Lindblom, Joakim F.

1988-01-01

An imaging soft X-ray microscope with a spatial resolution of 0.1 micron and normal incidence multilayer optics is discussed. The microscope has a Schwarzschild configuration, which consists of two concentric spherical mirrors with radii of curvature which minimize third-order spherical aberration, coma, and astigmatism. The performance of the Stanford/MSFC Cassegrain X-ray telescope and its relevance to the present microscope are addressed. A ray tracing analysis of the optical system indicates that diffraction-limited performance can be expected for an object height of 0.2 mm.

Development of the measurement system with interferometers for ultraprecise X-ray mirror

CERN Document Server

Yamauchi, K; Mimura, H

2003-01-01

A figure measurement system with a stitching method has been developed for evaluation and fabrication of the ultraprecise hard X-ray mirror optics. This system was constructed by two interferometers. One is the Michelson-type microscopic interferometer which is improved to keep the focus distance within 0.1 mu m. Another is the Fizeau's interferometer employed to compensate stitching error in the long spatial wavelength range. To estimate the absolute accuracy in this figure measurement system, the reflection X-ray intensity distributions of flat and aspherical mirrors, which are fabricated by us, were predicted by wave-optical simulation based on measured profile an compared with actually observed distributions. As the result, they are in good agreements. These agreements prove that the developed system has sub-nanometer absolute accuracy in all the spatial wavelength range longer than 0.5mm, because sub-nanometer figure error in those spatial wavelength ranges are known to affect reflection X-ray intensity ...

Optimization of parameters affecting LSM performance as diffractors of x rays: Final technical report, 13 May 1986-31 October 1987

International Nuclear Information System (INIS)

Knight, L.V.

1987-10-01

Our efforts during this contract period were directed toward a deeper understanding of several important issues related to multilayer x-ray mirrors. The results have important practical applications. The topics studied included: Basic Stress-Strain-Curvature Theory for Thin Silicon Wafers with Oxide and Nitride Films; this theory and accompanying experimental verification could form the basis for development of a code that will be able to predict the final figure of a silicon substrate that has been etched and treated with oxide or nitride films; this code will allow the design and fabrication of sophisticated curved multilayers; we have applied our theoretical understanding of multilayers to the design of multilayer x-ray optics; Multilayer X-ray Data Analysis Codes; these codes allow the massaging and display of x-ray multilayer characterization data in a wide variety of graphical ways; the code is user friendly; simulation of multilayers behavior in a high x-ray flux environment; this code combines an x-ray input code (BUCKL) with a 1-D hydrodynamic code (Chart-D) and our own iterative multilayer design code to determine the reflectivity of multilayers as a function of time when the multilayer is in a region of high x-ray flux; BUCKL and Chart-D are from Sandia Labs.; and we have completed the first series of experimental measurements of multilayer reflectivity while subjected to a pulse of intense x-ray flux; the experiments were done with the Phoenix laser at LLNL; the results are included. 48 refs., 29 figs

An x-ray microprobe using focussing optics with a synchrotron radiation source

International Nuclear Information System (INIS)

Thompson, A.C.; Underwood, J.H.; Wu, Y.; Giauque, R.D.

1989-01-01

An x-ray microprobe can be used to produce maps of the concentration of elements in a sample. Synchrotron radiation provides x-ray beams with enough intensity and collimation to make possible elemental images with femtogram sensitivity. The use of focussing x-ray mirrors made from synthetic multilayers with a synchrotron x-ray beam allows beam spot sizes of less than 10 μm /times/ 10 μm to be produced. Since minimal sample preparation is required and a vacuum environment is not necessary, there will be a wide variety of applications for such microprobes. 8 refs., 6 figs

In situ x-ray reflectivity and grazing incidence x-ray diffraction study of L 1{sub 0} ordering in {sup 57}Fe/Pt multilayers

Energy Technology Data Exchange (ETDEWEB)

Raghavendra Reddy, V; Gupta, Ajay; Gome, Anil [UGC-DAE Consortium for Scientific Research, University Campus, Khandwa Road, Indore-452 017 (India); Leitenberger, Wolfram [Institute of Physics, University of Potsdam, 14469 Potsdam (Germany); Pietsch, U [Physics Department, University of Siegen, D-57068 Siegen (Germany)], E-mail: vrreddy@csr.ernet.in, E-mail: varimalla@yahoo.com

2009-05-06

In situ high temperature x-ray reflectivity and grazing incidence x-ray diffraction measurements in the energy dispersive mode are used to study the ordered face-centered tetragonal (fct) L 1{sub 0} phase formation in [Fe(19 A)/Pt(25 A)]{sub x 10} multilayers prepared by ion beam sputtering. With the in situ x-ray measurements it is observed that (i) the multilayer structure first transforms to a disordered FePt and subsequently to an ordered fct L 1{sub 0} phase, (ii) the ordered fct L 1{sub 0} FePt peaks start to appear at 320 deg. C annealing, (iii) the activation energy of the interdiffusion is 0.8 eV and (iv) ordered fct FePt grains have preferential out-of-plane texture. The magneto-optical Kerr effect and conversion electron Moessbauer spectroscopies are used to study the magnetic properties of the as-deposited and 400 deg. C annealed multilayers. The magnetic data for the 400 {sup 0}C annealed sample indicate that the magnetization is at an angle of {approx}50 deg. from the plane of the film.

Fabrication of an 8:1 ellipsoidal mirror for a synchrotron x-ray microprobe

International Nuclear Information System (INIS)

Jones, K.W.; Takacs, P.Z.; Hastings, J.B.; Casstevens, J.M.; Pionke, C.D.

1987-01-01

The fabrication of an 8:1 demagnifying ellipsoidal mirror to be used for an x-ray microprobe at the National Synchrotron Light Source X-26 beam port is described. The design aim was to produce a mirror that could be used over the photon energy range from about 3 to 17 keV. The 300-mm long mirror was required to operate at a grazing angle of 5 mr. The semimajor axis was 4500 mm and the semiminor axis 14.142 mm. Surface roughness of 1 nm or less and slope errors of 1 arc second parallel to the long axis and 200 arc seconds parallel to the short direction were specified. Production of the first electroless nickel-coated aluminum mirror using a diamond-turning technique has been completed. The mirror meets the 1 arc sec surface figure specification except for areas near the ends of the mirror. The reasons for these deviations arise from subtle details of the diamond-turning process which have not been fully incorporated in to the computer program that controls the diamond-turning machines. Further work in computer correction of repeatable errors of the diamond-turning machine can eliminate the waviness at the ends of the mirror. The diamond-turned mirror surface was not fully polished under this effort and therefore does not meet the roughness specification; however, surface smoothness of a fully polished cylindrical mirror manufactured using the same techniques does not meet the specification. It can be concluded that it is now technically feasible to meet the required specifications for the mirror and that the x-ray microprobe based on its use can be achieved

Surface Slope Metrology on Deformable Soft X-ray Mirrors

International Nuclear Information System (INIS)

Yuan, Sheng; Yashchuk, Valeriy V.; Goldberg, Kenneth A.; Celestre, Rich; Church, Matthew; McKinney, Wayne R.; Morrison, Greg; Warwick, Tony

2010-01-01

We report on the current state of surface slope metrology on deformable mirrors for soft x-rays at the Advanced Light Source (ALS). While we are developing techniques for in situ at-wavelength tuning, we are refining methods of ex situ visible-light optical metrology to achieve sub-100-nrad accuracy. This paper reports on laboratory studies, measurements and tuning of a deformable test-KB mirror prior to its use. The test mirror was bent to a much different optical configuration than its original design, achieving a 0.38 micro-radian residual slope error. Modeling shows that in some cases, by including the image conjugate distance as an additional free parameter in the alignment, along with the two force couples, fourth-order tangential shape errors (the so-called bird shape) can be reduced or eliminated.

Surface Slope Metrology on Deformable Soft X-ray Mirrors

International Nuclear Information System (INIS)

Yuan, S.; Yashchuk, V.V.; Goldberg, K.A.; Celestre, R.; Church, M.; McKinney, W.R.; Morrison, G.; Warwick, T.

2009-01-01

We report on the current state of surface slope metrology on deformable mirrors for soft x-rays at the Advanced Light Source (ALS). While we are developing techniques for in situ at-wavelength tuning, we are refining methods of ex situvisible-light optical metrology to achieve sub-100-nrad accuracy. This paper reports on laboratory studies, measurements and tuning of a deformable test-KB mirror prior to its use. The test mirror was bent to a much different optical configuration than its original design, achieving a 0.38 micro-radian residual slope error. Modeling shows that in some cases, by including the image conjugate distance as an additional free parameter in the alignment, along with the two force couples, fourth-order tangential shape errors (the so-called bird shape) can be reduced or eliminated.

Coating Thin Mirror Segments for Lightweight X-ray Optics

Science.gov (United States)

Chan, Kai-Wing; Sharpe, Marton V.; Zhang, William; Kolosc, Linette; Hong, Melinda; McClelland, Ryan; Hohl, Bruce R.; Saha, Timo; Mazzarellam, James

2013-01-01

Next generations lightweight, high resolution, high throughput optics for x-ray astronomy requires integration of very thin mirror segments into a lightweight telescope housing without distortion. Thin glass substrates with linear dimension of 200 mm and thickness as small as 0.4 mm can now be fabricated to a precision of a few arc-seconds for grazing incidence optics. Subsequent implementation requires a distortion-free deposition of metals such as iridium or platinum. These depositions, however, generally have high coating stresses that cause mirror distortion. In this paper, we discuss the coating stress on these thin glass mirrors and the effort to eliminate their induced distortion. It is shown that balancing the coating distortion either by coating films with tensile and compressive stresses, or on both sides of the mirrors is not sufficient. Heating the mirror in a moderately high temperature turns out to relax the coated films reasonably well to a precision of about a second of arc and therefore provide a practical solution to the coating problem.

Rocket Experiment Demonstration of a Soft X-ray Polarimeter

Science.gov (United States)

Marshall, Herman

This proposal is the lead proposal. Boston University will submit, via NSPIRES, a Co-I proposal, per instructions for Suborbital proposals for multiple-award. Our scientific goal of the Rocket Experiment Demonstration of a Soft X-ray Polarimeter (REDSoX Polarimeter) is to make the first measurement of the linear X-ray polarization of an extragalactic source in the 0.2-0.8 keV band. The first flight of the REDSoX Polarimeter would target Mk 421, which is commonly modeled as a highly relativistic jet aimed nearly along the line of sight. Such sources are likely to be polarized at a level of 30-60%, so the goal is to obtain a significant detection even if it is as low as 10%. Significant revisions to the models of jets emanating from black holes at the cores of active galaxies would be required if the polarization fraction lower than 10%. We employ multilayer-coated mirrors as Bragg reflectors at the Brewster angle. By matching to the dispersion of a spectrometer, one may take advantage of high multilayer reflectivities and achieve polarization modulation factors over 90%. Using replicated foil mirrors from MSFC and gratings made at MIT, we construct a spectrometer that disperses to three laterally graded multilayer mirrors (LGMLs). The lateral grading changes the wavelength of the Bragg peak for 45 degree reflections linearly across the mirror, matching the dispersion of the spectrometer. By dividing the entrance aperture into six equal sectors, pairs of blazed gratings from opposite sectors are oriented to disperse to the same LGML. The position angles for the LGMLs are 120 degrees to each other. CCD detectors then measure the intensities of the dispersed spectra after reflection and polarizing by the LGMLs, giving the three Stokes parameters needed to determine the source polarization. We will rely on components whose performance has been verified in the laboratory or in space. The CCD detectors are based on Chandra and Suzaku heritage. The mirror fabrication team

Figure and Dimension Metrology of Extremely Lightweight X-Ray Mirrors for Space Astronomy Applications

Science.gov (United States)

Zhang, William W.

2010-01-01

The International X-ray Observatory (IXO) is the next major space X-ray observatory, performing both imaging and spectroscopic studies of all kinds of objects in the Universe. It is a collaborative mission of the National Aeronautics and Space Administration of the United States, the European Space Agency, and Japan Aerospace Exploration Agency. It is to be launched into a Sun-Earth L2 orbit in 2021. One of the most challenging aspects of the mission is the construction of a flight mirror assembly capable focusing X-rays in the band of 0.1 to 40 keY with an angular resolution of better than 5 arc-seconds and with an effective collection area of more than 3 sq m. The mirror assembly will consist of approximately 15,000 parabolic and hyperbolic mirror segments, each of which is approximately 200mm by 300mm with a thickness of 0.4mm. The manufacture and qualification of these mirror segments and their integration into the giant mirror assembly have been the objectives of a vigorous technology development program at NASA's Goddard Space Flight Center. Each of these mirror segments needs to be measured and qualified for both optical figure and mechanical dimensions. In this talk, I will describe the technology program with a particular emphasis on a measurement system we are developing to meet those requirements, including the use of coordinate measuring machines, Fizeau interferometers, and custom-designed, and -built null lens. This system is capable of measuring highly off-axis aspherical or cylindrical mirrors with repeatability, accuracy, and speed.

Structure in defocused beams of x-ray mirrors: causes and possible solutions

Science.gov (United States)

Sutter, John P.; Alcock, Simon G.; Rust, Fiona; Wang, Hongchang; Sawhney, Kawal

2014-09-01

Grazing incidence mirrors are now a standard optic for focusing X-ray beams. Both bimorph and mechanically bendable mirrors are widely used at Diamond Light Source because they permit a wide choice of focal lengths. They can also be deliberately set out of focus to enlarge the X-ray beam, and indeed many beamline teams now wish to generate uniform beam spots of variable size. However, progress has been slowed by the appearance of fine structure in these defocused beams. Measurements showing the relationship between the medium-frequency polishing error and this structure over a variety of beam sizes will be presented. A theoretical model for the simulations of defocused beams from general mirrors will then be developed. Not only the figure error and its first derivative the slope error, but also the second derivative, the curvature error, must be considered. In conclusion, possible ways to reduce the defocused beam structure by varying the actuators' configuration and settings will be discussed.

Iridium/Iridium Silicide as an Oxidation Resistant Capping Layer for Soft X-ray Mirrors

International Nuclear Information System (INIS)

Prisbrey, S; Vernon, S

2004-01-01

Rust on a sword, tarnish on the silverware, and a loss in reflectivity for soft x-ray mirrors are all caused by oxidation that changes the desired characteristics of a material. Methods to prevent the oxidation have varied over the centuries with the default method of a protective coating being the most common. The protective coating for x-ray mirrors is usually a self-limiting oxidized layer on the surface of the material that stops further oxidation of the material by limiting the diffusion of oxygen to the material underneath

Laboratory-size three-dimensional x-ray microscope with Wolter type I mirror optics and an electron-impact water window x-ray source

Energy Technology Data Exchange (ETDEWEB)

Ohsuka, Shinji, E-mail: ohsuka@crl.hpk.co.jp [Hamamatsu Photonics K.K., 5000 Hirakuchi, Hamakita-ku, Hamamatsu-City, 434-8601 (Japan); The Graduate School for the Creation of New Photonics Industries, 1955-1 Kurematsu-cho, Nishi-ku, Hamamatsu-City, 431-1202 (Japan); Ohba, Akira; Onoda, Shinobu; Nakamoto, Katsuhiro [Hamamatsu Photonics K.K., 5000 Hirakuchi, Hamakita-ku, Hamamatsu-City, 434-8601 (Japan); Nakano, Tomoyasu [Hamamatsu Photonics K.K., 5000 Hirakuchi, Hamakita-ku, Hamamatsu-City, 434-8601 (Japan); Ray-Focus Co. Ltd., 6009 Shinpara, Hamakita-ku, Hamamatsu-City, 434-0003 (Japan); Miyoshi, Motosuke; Soda, Keita; Hamakubo, Takao [Research Center for Advanced Science and Technology, The University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8904 (Japan)

2014-09-15

We constructed a laboratory-size three-dimensional water window x-ray microscope that combines wide-field transmission x-ray microscopy with tomographic reconstruction techniques, and observed bio-medical samples to evaluate its applicability to life science research fields. It consists of a condenser and an objective grazing incidence Wolter type I mirror, an electron-impact type oxygen Kα x-ray source, and a back-illuminated CCD for x-ray imaging. A spatial resolution limit of around 1.0 line pairs per micrometer was obtained for two-dimensional transmission images, and 1-μm scale three-dimensional fine structures were resolved.

Laboratory-size three-dimensional x-ray microscope with Wolter type I mirror optics and an electron-impact water window x-ray source.

Science.gov (United States)

Ohsuka, Shinji; Ohba, Akira; Onoda, Shinobu; Nakamoto, Katsuhiro; Nakano, Tomoyasu; Miyoshi, Motosuke; Soda, Keita; Hamakubo, Takao

2014-09-01

We constructed a laboratory-size three-dimensional water window x-ray microscope that combines wide-field transmission x-ray microscopy with tomographic reconstruction techniques, and observed bio-medical samples to evaluate its applicability to life science research fields. It consists of a condenser and an objective grazing incidence Wolter type I mirror, an electron-impact type oxygen Kα x-ray source, and a back-illuminated CCD for x-ray imaging. A spatial resolution limit of around 1.0 line pairs per micrometer was obtained for two-dimensional transmission images, and 1-μm scale three-dimensional fine structures were resolved.

Point spread function and centroiding accuracy measurements with the JET-X mirror and MOS CCD detector of the Swift gamma ray burst explorer's X-ray telescope

CERN Document Server

Ambrosi, R M; Hutchinson, I B; Willingale, R; Wells, A; Short, A D T; Campana, S; Citterio, O; Tagliaferri, G; Burkert, W; Bräuninger, H

2002-01-01

The optical components of the Swift X-ray telescope (XRT) are already developed items. They are the flight spare X-ray mirror from the JET-X/Spectrum-X program and an MOS CCD (CCD22) of the type currently operating in orbit as part of the EPIC focal plane camera on XMM-Newton (SPIE 4140 (2000) 64). The JET-X mirrors were first calibrated at the Max Planck Institute for Extraterrestrial Physics' (MPE) Panter facility, Garching, Germany in 1996 (SPIE 2805 (1996) 56; SPIE 3114 (1997) 392). Half-energy widths of 16 arcsec at 1.5 keV were confirmed for the two flight mirrors and the flight spare. The calibration of the flight spare was repeated at Panter in July 2000 in order to establish whether any changes had occurred during the 4 yr that the mirror had been in storage at the OAB, Milan, Italy. The results reported in this paper confirm that the resolution of the JET-X mirrors has remained stable over this storage period. In an extension of this test program, the flight spare EPIC camera was installed at the fo...

Effect of FEL induced ionization on X-ray reflectivity of multilayers

Energy Technology Data Exchange (ETDEWEB)

Ksenzov, Dmitriy; Grigorian, Souren; Pietsch, Ullrich [University of Siegen (Germany)

2009-07-01

The VUV-FEL in Hamburg (FLASH) emits short-pulse radiation with wavelengths from 6 to 30 nm and a pulse length of 10-50 fs. The FLASH wavelength allows x-ray diffraction experiments at periodical multilayer's structures acting as 1D crystal. The probe of depth selective interaction of the high-intense x-ray short pulse with these objects can be used to obtain information about possible electronic excitation and various recombination processes inside multilayers. As known from recent experiments at FLASH, the later ones are most likely using highly intense FEL radiation. The ML reflectivity is analyzed for case of that the optical parameters are changing as function of the depth of the penetrating incident pulse into the multilayer. The response is studied for the model system La/B{sub 4}C using two experimental conditions both at fixed incidence angle: 1) the energy of the incident pulses, E, coincides with the energy of the 1st order multilayer Bragg peak, E{sub B}, of the reflection curve, and 2) the energy of incident pulse differs by a small dE from E{sub B}. The ML response to a given sub-pulse differs for both conditions. However, there is a clear fingerprint of ionization for both conditions for the case that E is close to the K-absorption edge of B-atoms. Our results support respective efforts to measure the optical parameters of solids under high-intense FEL radiation.

Direct intensity calibration of X-ray grazing-incidence microscopes with home-lab source

Science.gov (United States)

Li, Yaran; Xie, Qing; Chen, Zhiqiang; Xin, Qiuqi; Wang, Xin; Mu, Baozhong; Wang, Zhanshan; Liu, Shenye; Ding, Yongkun

2018-01-01

Direct intensity calibration of X-ray grazing-incidence microscopes is urgently needed in quantitative studies of X-ray emission from laser plasma sources in inertial confinement fusion. The existing calibration methods for single reflecting mirrors, crystals, gratings, filters, and X-ray detectors are not applicable for such X-ray microscopes due to the specific optical structure and the restrictions of object-image relation. This article presents a reliable and efficient method that can be performed using a divergent X-ray source and an energy dispersive Si-PIN (silicon positive-intrinsic-negative) detector in an ordinary X-ray laboratory. The transmission theory of X-ray flux in imaging diagnostics is introduced, and the quantities to be measured are defined. The calibration method is verified by a W/Si multilayer-coated Kirkpatrick-Baez microscope with a field of view of ˜95 μm at 17.48 keV. The mirror reflectance curve in the 1D coordinate is drawn with a peak value of 20.9% and an uncertainty of ˜6.0%.

Analytic theory of soft x-ray diffraction by lamellar multilayer gratings

NARCIS (Netherlands)

Kozhevnikov, I.V.; van der Meer, R.; Bastiaens, Hubertus M.J.; Boller, Klaus J.; Bijkerk, Frederik

2011-01-01

An analytic theory describing soft x-ray diffraction by Lamellar Multilayer Gratings (LMG) has been developed. The theory is derived from a coupled waves approach for LMGs operating in the single-order regime, where an incident plane wave can only excite a single diffraction order. The results from

Neutron, x-ray scattering and TEM studies of Ni-Ti multilayers

International Nuclear Information System (INIS)

Keem, J.E.; Wood, J.; Grupido, N.; Hart, K.; Nutt, S.; Reichel, D.G.; Yelon, W.B.

1988-01-01

The authors present an analysis of Ni-Ti multilayer neutron reflectors and supermirrors undertaken to identify the causes of the lower than expected observed scattering power and critical angle enhancement of Ni-Ti supermirrors. Results of these investigations focus attention on cusp formation in the Ni-Ti bilayers as probable cause for the reduced neutron scattering power. Grazing angle x-ray and neutron scattering, wide angle neutron diffraction and analytical cross sectional TEM have been used. The multilayers were produced by magnetron sputtering and ion-beam deposition on float glass substrates and silicon wafers

A Magnetron Sputter Deposition System for the Development of Multilayer X-Ray Optics

Data.gov (United States)

National Aeronautics and Space Administration — The proposal objective is to establish the capability to deposit multilayer structures for X-ray, neutron, and EUV optic applications through the development of a...

X-ray imagery

International Nuclear Information System (INIS)

Dhez, P.

1986-01-01

Direct projection, pin diaphragm, lenses, mirrors and holography are used for X images. Each method is examined, radiation source problem is taken in account. For instance, the important role of synchrotron radiation in direct projection is noticed (angiography, microlithography, isotope separation). The pin diaphragm is used for laser-plasma images. Two use techniques of mirrors are presented: in grazing incidence (X-UV telescopes on satellite board) or in normal incidence (new ''laminated'' mirrors). This second technique, which uses interferences, seems to be the unique solution to equip optical cavities of X lasers. More classically, the multilayered mirrors are applicated to X microscopes (with synchrotron radiation). Lenses use diffraction. They lead to scanning X microscopes. At last, reconstruction methods of image are reviewed: different from computer are topography interferometry and holography. These three last ones are precised. In conclusion, the X optics application to two-dimensional material physics is recalled [fr

Irradiated radiation dose measurements of multilayer mirrors and permanent magnets used at FELI facilities

International Nuclear Information System (INIS)

Wakisaka, K.; Tongu, H.; Okuma, S.; Oshita, E.; Wakita, K.; Takii, T.; Tomimasu, Takio

1997-01-01

Recently the operation time of the free electron laser (FEL) user's facilities is close on three thousand hours per year. Cavity mirrors of their optical resonators and permanent magnets of their undulators are used under high intensity radiation field along their high current electron beam lines. Among these mirrors and permanent magnets, multilayer mirrors and Nd-Fe-B permanent magnets are not so strong against radiation damage compared with Au-coated copper mirrors and Sm-Co permanent magnets. A radiation damage on Ta 2 O 5 /SiO 2 mirrors was found for the first time after about fifty hours visible FEL operation at the FELI. The damage is due to irradiated bremsstrahlung and intracavity FEL. However, radiation damages on Nd-Fe-B permanent magnets were already reported compared with Sm-Co ones using high energy neutrons, protons, deuterons and 60 Coγ-rays. Mixed irradiation effects of 85-MeV electrons, bremsstrahlung and 60 Coγ-rays and of 17-MeV electrons and 60 Coγ-rays were also studied. The latest results show that the magnetic flux loss of Nd-Fe-B is 2% at an absorbed dose of 10 MGy. The present work was carried out to study the irradiated dose distributions near the multilayer mirrors and Nd-Fe-B permanent magnets with thermoluminescence dosimeters (TLDs). The irradiated dose to the cavity mirrors used in Linac-based FEL experiment is estimated to be 0.3 MGray for fifty hours irradiation. The irradiated dose to the Nd-Fe-B magnets is estimated to be 16 MGray for 2 thousand hours operation. The decrease of their magnetic flux due to 16 MGray is estimated to be about 3%. These dose monitorings are useful to reduce irradiated dosages to the mirrors and the permanent magnets as low as possible and to estimate their safety lifetimes. (author)

A study of the reactivity of elemental Cr/Se/Te thin multilayers using X-ray reflectometry, in situ X-ray diffraction and X-ray absorption spectroscopy

International Nuclear Information System (INIS)

Behrens, Malte; Tomforde, Jan; May, Enno; Kiebach, Ragnar; Bensch, Wolfgang; Haeussler, Dietrich; Jaeger, Wolfgang

2006-01-01

The reactivity of [Cr/Se/Te] multilayers under annealing was investigated using X-ray reflectometry, in situ X-ray diffraction, X-ray absorption fine structure (XAFS) measurements and transmission electron microscopy. For all samples, interdiffusion was complete at temperatures between 100 and 300 deg. C, depending on the repeating tri-layer thickness. A crystalline phase nucleated approximately 20 deg. C above the temperature where interdiffusion was finished. The first crystalline phase in a binary Cr/Te sample was layered CrTe 3 nucleating at 230 deg. C. In ternary samples (Se:Te=0.6-1.2), the low-temperature nucleation of such a layered CrQ 3 (Q=Se, Te) phase is suppressed and instead the phase Cr 2 Q 3 nucleates first. Interestingly, this phase decomposes around 500 deg. C into layered CrQ 3 . In contrast, binary Cr/Se samples form stable amorphous alloys after interdiffusion and Cr 3 Se 4 nucleates around 500 deg. C as the only crystalline phase. Evaluation of the XAFS data of annealed samples yield Se-Cr distances of 2.568(1) and 2.552(1) A for Cr 2 Q 3 and CrQ 3 , respectively. In the latter sample, higher coordination shells around Se are seen accounting for the Se-Te contacts in the structure. - Graphical abstract: The first step of the reaction of elemental Cr/Te/Se-multilayers is the interdiffusion of the elements as evidenced by the decay of the modulation peaks in the low-angle region of the X-ray diffraction patterns. The subsequent growth of Bragg peaks at higher scattering angles indicates crystallization of chromium chalcogenide Cr 2 Te 3- x Se x

Upgrading multilayer zone plate technology for hard x-ray focusing

Energy Technology Data Exchange (ETDEWEB)

Hirotomo, Toshiki; Konishi, Shigeki [Graduate School of Material Science, University of Hyogo, Kamigori, Hyogo 678-1297 (Japan); SPring-8 Service Co., Ltd (Japan); Takano, Hidekazu, E-mail: htakano@sci.u-hyogo.ac.jp; Sumida, Kazuhiro; Tsusaka, Yoshiyuki; Kagoshima, Yasushi [Graduate School of Material Science, University of Hyogo, Kamigori, Hyogo 678-1297 (Japan); Koyama, Takahisa [Graduate School of Material Science, University of Hyogo, Kamigori, Hyogo 678-1297 (Japan); Japan Synchrotron Radiation Research Institute (JASRI/SPring-8) (Japan); Ichimaru, Satoshi; Ohchi, Tadayuki [NTT Advanced Technology Corporation (Japan); Takenaka, Hisataka [NTT Advanced Technology Corporation (Japan); TOYAMA Corporation (Japan)

2016-01-28

Multilayer zone plate (MZP) technology for hard X-ray focusing was upgraded and its focusing performance was evaluated using 20-keV X-rays at the synchrotron beamline (BL24XU) of SPring-8. The MZP consists of MoSi{sub 2} and Si layers alternately deposited on a glass fiber by magnetron sputtering so that all zone boundaries satisfy the Fresnel zone configuration. The focused beam was evaluated using knife-edge scanning in which the measured intensity distribution is identical to the line spread function (LSF) in the focal plane. The focused beamsize of about 30 nm was estimated by oscillation peaks observed in the measured LSF according to Rayleigh’s criterion.

Optimizing x-ray mirror thermal performance using variable length cooling for second generation FELs

Science.gov (United States)

Hardin, Corey L.; Srinivasan, Venkat N.; Amores, Lope; Kelez, Nicholas M.; Morton, Daniel S.; Stefan, Peter M.; Nicolas, Josep; Zhang, Lin; Cocco, Daniele

2016-09-01

The success of the LCLS led to an interest across a number of disciplines in the scientific community including physics, chemistry, biology, and material science. Fueled by this success, SLAC National Accelerator Laboratory is developing a new high repetition rate free electron laser, LCLS-II, a superconducting linear accelerator capable of a repetition rate up to 1 MHz. Undulators will be optimized for 200 to 1300 eV soft X-rays, and for 1000 to 5000 eV hard X-rays. To absorb spontaneous radiation, higher harmonic energies and deflect the x-ray beam to various end stations, the transport and diagnostics system includes grazing incidence plane mirrors on both the soft and Hard X-ray beamline. To deliver the FEL beam with minimal power loss and wavefront distortion, we need mirrors of height errors below 1nm rms in operational conditions. We need to mitigate the thermal load effects due to the high repetition rate. The absorbed thermal profile is highly dependent on the beam divergence, and this is a function of the photon energy. To address this complexity, we developed a mirror cradle with variable length cooling and first order curve correction. Mirror figure error is minimized using variable length water-cooling through a gallium-indium eutectic bath. Curve correction is achieved with an off-axis bender that will be described in details. We present the design features, mechanical analysis and results from optical and mechanical tests of a prototype assembly, with particular regards to the figure sensitivity to bender corrections.

Coherent, Short-Pulse X-ray Generation via Relativistic Flying Mirrors

Directory of Open Access Journals (Sweden)

Masaki Kando

2018-04-01

Full Text Available Coherent, Short X-ray pulses are demanded in material science and biology for the study of micro-structures. Currently, large-sized free-electron lasers are used; however, the available beam lines are limited because of the large construction cost. Here we review a novel method to downsize the system as well as providing fully (spatially and temporally coherent pulses. The method is based on the reflection of coherent laser light by a relativistically moving mirror (flying mirror. Due to the double Doppler effect, the reflected pulses are upshifted in frequency and compressed in time. Such mirrors are formed when an intense short laser pulse excites a strongly nonlinear plasma wave in tenuous plasma. Theory, proof-of-principle, experiments, and possible applications are addressed.

Characterization of ion-beam mixed multilayers via grazing x-ray reflectometry

International Nuclear Information System (INIS)

Le Boite, M.G.; Traverse, A.; Nevot, L.; Pardo, B.; Corno, J.

1988-01-01

The grazing x-ray reflectrometry technique was used as a way to study modifications in metallic multilayers induced by ion-beam irradiation. Due to the high sensitivity of the technique, short-range atomic displacements of an atom A in a layer B can be detected so that the first stages of ion-beam mixing can be investigated. The rate of mixing is measured and the compound A/sub 1-//sub x/B/sub x/ formed at the layers' interfaces is characterized

Development of a Wolter Optic X-ray Imager on Z

Science.gov (United States)

Fein, Jeffrey R.; Ampleford, David J.; Vogel, Julia K.; Kozioziemski, Bernie; Walton, Christopher C.; Wu, Ming; Ayers, Jay; Ball, Chris J.; Bourdon, Chris J.; Maurer, Andrew; Pivovaroff, Mike; Ramsey, Brian; Romaine, Suzanne

2017-10-01

A Wolter optic x-ray imager is being developed for the Z Machine to study the dynamics of warm x-ray sources with energies above 10 keV. The optic is adapted from observational astronomy and uses multilayer-coated, hyperbolic and parabolic x-ray mirrors to form a 2D image with predicted 100- μm resolution over a 5x5-mm field of view. The imager is expected to have several advantages over a simple pinhole camera. In particular, it can form quasi mono-energetic images due to the inherent band-pass nature of the x-ray mirrors from Bragg diffraction. As well, its larger collection solid angle can lead to an overall increase in efficiency for the x-rays in the desirable energy band. We present the design of the imaging system, which is initially optimized to view Mo K-alpha x-rays (17.5 keV). In addition, we will present preliminary measurements of the point-spread function as well as the spectral sensitivity of the instrument. Sandia National Laboratories is a multimission laboratory managed and operated by NTESS, LLC., a wholly owned subsidiary of Honeywell International, Inc., for the U.S. DOE's NNSA under contract DE-NA-0003525.

Multilayer roughness and image formation in the Schwarzschild objective

International Nuclear Information System (INIS)

Singh, S.; Solak, H.; Cerrina, F.

1996-01-01

We present a study of the effect of multilayer-surface-roughness-induced scattering in the image formation of the Schwarzschild objective (SO) used in the spectromicroscope MAXIMUM. The two mirrors comprising the SO are coated with Ru/B 4 C multilayers that have a peak reflectivity at 130 eV. We had long observed that a diffuse x-ray background surrounds the focused x-ray spot. The spatial resolution remains at 0.1 μm in spite of this. However, since a significant fraction of the flux is lost to the background, since too large an area of the sample is illuminated, and since the S/N ratio is degraded, the origins of this effect merit investigation. This diffuse background resulting from x-ray scattering at the surface of the mirrors was mapped out using bidirectional knife edge scans. Complementary surface roughness simulations were carried out with the ray-tracing program SHADOW. AFM experiments were also done to directly measure the surface roughness and power spectrum of representative multilayers. Following curve fitting, it was possible to classify Gaussian components in both the measured and simulated profiles as arising from scattering occurring at either the convex primary mirror or the concave secondary mirror. Together with geometrical analysis, these techniques permitted us to track the image formation process of an actual optical system in the presence of surface roughness. copyright 1996 American Institute of Physics

Nano-metrology: The art of measuring X-ray mirrors with slope errors <100 nrad.

Science.gov (United States)

Alcock, Simon G; Nistea, Ioana; Sawhney, Kawal

2016-05-01

We present a comprehensive investigation of the systematic and random errors of the nano-metrology instruments used to characterize synchrotron X-ray optics at Diamond Light Source. With experimental skill and careful analysis, we show that these instruments used in combination are capable of measuring state-of-the-art X-ray mirrors. Examples are provided of how Diamond metrology data have helped to achieve slope errors of <100 nrad for optical systems installed on synchrotron beamlines, including: iterative correction of substrates using ion beam figuring and optimal clamping of monochromator grating blanks in their holders. Simulations demonstrate how random noise from the Diamond-NOM's autocollimator adds into the overall measured value of the mirror's slope error, and thus predict how many averaged scans are required to accurately characterize different grades of mirror.

Dynamics of a multiple-pulse-driven x-ray laser plasma

International Nuclear Information System (INIS)

Wan, A.S.; Da Silva, L.B.; Moreno, J.C.; Cauble, R.; Celliers, P.; Dalhed, H.E. Jr.; Koch, J.A.; Nilsen, J.

1996-01-01

In this paper we describe experimental and computational studies of multiple-pulse-driven laser plasma, which is the gain medium for a neon-like yttrium x-ray laser. Near-field emission profiles have been measured both with and without reinjection of the x-ray laser photons to couple with the amplifying medium created by later pulses using an external multilayer mirror. From the temporal and spatial evolution of the near-field emission profiles we can examine the pulse-to-pulse variation of the x-ray laser plasma due to changes in the hydrodynamics, laser deposition, and the injecting of x-ray laser photons back into an amplifying x-ray laser plasma. Using a combination of radiation hydrodynamics, atomic kinetics, and ray propagation codes, reasonable agreement has been obtained between simulations and the experimental results. copyright 1996 American Institute of Physics

Characterization of a next-generation piezo bimorph X-ray mirror for synchrotron beamlines.

Science.gov (United States)

Alcock, Simon G; Nistea, Ioana; Sutter, John P; Sawhney, Kawal; Fermé, Jean Jacques; Thellièr, Christophe; Peverini, Luca

2015-01-01

Piezo bimorph mirrors are versatile active optics used on many synchrotron beamlines. However, many bimorphs suffer from the `junction effect': a periodic deformation of the optical surface which causes major aberrations to the reflected X-ray beam. This effect is linked to the construction of such mirrors, where piezo ceramics are glued directly below the thin optical substrate. In order to address this problem, a next-generation bimorph with piezos bonded to the side faces of a monolithic substrate was developed at Thales-SESO and optimized at Diamond Light Source. Using metrology feedback from the Diamond-NOM, the optical slope error was reduced to ∼ 0.5 µrad r.m.s. for a range of ellipses. To maximize usability, a novel holder was built to accommodate the substrate in any orientation. When replacing a first-generation bimorph on a synchrotron beamline, the new mirror significantly improved the size and shape of the reflected X-ray beam. Most importantly, there was no evidence of the junction effect even after eight months of continuous beamline usage. It is hoped that this new design will reinvigorate the use of active bimorph optics at synchrotron and free-electron laser facilities to manipulate and correct X-ray wavefronts.

Spectral characterisation of aperiodic normal-incidence Sb/B4C multilayer mirrors for the λ < 124 Å range

Science.gov (United States)

Vishnyakov, E. A.; Kopylets, I. A.; Kondratenko, V. V.; Kolesnikov, A. O.; Pirozhkov, A. S.; Ragozin, E. N.; Shatokhin, A. N.

2018-03-01

Three broadband aperiodic Sb/B4C multilayer mirrors were synthesised for the purposes of soft X-ray optics and spectroscopy in the wavelength range beyond the L-edge of Si (λ plasma radiation source and an electronic detector with a 2D spatial resolution (a CCD matrix with 13 × 13 μm sized pixels). The experimental spectra are compared with theoretical calculations. The effect of lower antimony and B4C layer densities on the reflection spectra is discussed.

First images from the Stanford tabletop scanning soft x-ray microscope

International Nuclear Information System (INIS)

Trail, J.A.; Byer, R.L.

1988-01-01

The authors have constructed a scanning soft x-ray microscope which uses a laser-produced plasma as the soft x-ray source and normal incidence multilayer coated mirrors in a Schwarzschild configuration as the focusing optics. The microscope operates at a wavelength of 140 angstrom, has a spatial resolution of 0.5 μm, and has a soft x-ray photon flux through the focus of 10 4 s -1 when operated with only 170 mW of average laser power. The microscope is compact; the complete system, including the laser, fits on a single optical table. In this paper they describe the microscope and present images of metallic microstructures

Kossel interferences of proton-induced X-ray emission lines in periodic multilayers

Energy Technology Data Exchange (ETDEWEB)

Wu, Meiyi; Le Guen, Karine; André, Jean-Michel [Sorbonne Universités, UPMC Univ Paris 06, Laboratoire de Chimie Physique-Matière et Rayonnement, 11 rue Pierre et Marie Curie, F-75231 Paris cedex 05 (France); CNRS UMR 7614, Laboratoire de Chimie Physique-Matière et Rayonnement, 11 rue Pierre et Marie Curie, F-75231 Paris cedex 05 (France); Ilakovac, Vita [Sorbonne Universités, UPMC Univ Paris 06, Laboratoire de Chimie Physique-Matière et Rayonnement, 11 rue Pierre et Marie Curie, F-75231 Paris cedex 05 (France); CNRS UMR 7614, Laboratoire de Chimie Physique-Matière et Rayonnement, 11 rue Pierre et Marie Curie, F-75231 Paris cedex 05 (France); Université de Cergy-Pontoise, F-95031 Cergy-Pontoise (France); Vickridge, Ian [Sorbonne Universités, UPMC Univ Paris 06, Institut des NanoSciences de Paris, 4 place Jussieu, boîte courrier 840, F-75252 Paris cedex 05 (France); CNRS UMR 7588, Institut des NanoSciences de Paris, 4 place Jussieu, boîte courrier 840, F-75252 Paris cedex 05 (France); Schmaus, Didier [Sorbonne Universités, UPMC Univ Paris 06, Institut des NanoSciences de Paris, 4 place Jussieu, boîte courrier 840, F-75252 Paris cedex 05 (France); CNRS UMR 7588, Institut des NanoSciences de Paris, 4 place Jussieu, boîte courrier 840, F-75252 Paris cedex 05 (France); Université Paris Diderot-P7, F-75205 Paris cedex 13 (France); and others

2016-11-01

The Kossel interferences generated by characteristic X-ray lines produced inside a periodic multilayer have been observed upon proton irradiation, by submitting a Cr/B{sub 4}C/Sc multilayer stack to 2 MeV protons and observing the intensity of the Sc and Cr Kα characteristic emissions as a function of the detection angle. When this angle is close to the Bragg angle corresponding to the emission wavelength and period of the multilayer, an oscillation of the measured intensity is detected. The results are in good agreement with a model based on the reciprocity theorem. The combination of the Kossel measurements and their simulation, will be a useful tool to obtain a good description of the multilayer stack and thus to study nanometer-thick layers and their interfaces.

Progress towards sub-micron hard x-ray imaging using elliptically bent mirrors and its applications

International Nuclear Information System (INIS)

MacDowell, A.A.; Lamble, G.M.; Celestre, R.S.; Padmore, H.A.; Chang, C.H.; Patel, J.R.

1998-06-01

The authors have developed an x-ray micro-probe facility utilizing mirror bending techniques that allow white light x-rays (4--12keV) from the Advanced light Source Synchrotron to be focused down to spot sizes of micron spatial dimensions. They have installed a 4 crystal monochromator prior to the micro-focusing mirrors. The monochromator is designed such that it can move out of the way of the input beam, and allows the same micron sized sample to be illuminated with either white or monochromatic radiation. Illumination of the sample with white light allows for elemental mapping and Laue x-ray diffraction, while illumination of the sample with monochromatic light allows for elemental mapping (with reduced background), micro-X-ray absorption spectroscopy and micro-diffraction. The performance of the system will be described as will some of the initial experiments that cover the various disciplines of Earth, Material and Life Sciences

Progress towards sub-micron hard x-ray imaging using elliptically bent mirrors and its applications

Energy Technology Data Exchange (ETDEWEB)

MacDowell, A.A.; Lamble, G.M.; Celestre, R.S.; Padmore, H.A. [Lawrence Berkeley National Lab., CA (United States); Chang, C.H.; Patel, J.R. [Lawrence Berkeley National Lab., CA (United States). Advanced Light Source Div.]|[Stanford Univ., CA (United States)

1998-06-01

The authors have developed an x-ray micro-probe facility utilizing mirror bending techniques that allow white light x-rays (4--12keV) from the Advanced light Source Synchrotron to be focused down to spot sizes of micron spatial dimensions. They have installed a 4 crystal monochromator prior to the micro-focusing mirrors. The monochromator is designed such that it can move out of the way of the input beam, and allows the same micron sized sample to be illuminated with either white or monochromatic radiation. Illumination of the sample with white light allows for elemental mapping and Laue x-ray diffraction, while illumination of the sample with monochromatic light allows for elemental mapping (with reduced background), micro-X-ray absorption spectroscopy and micro-diffraction. The performance of the system will be described as will some of the initial experiments that cover the various disciplines of Earth, Material and Life Sciences.

Fabrication of the multilayer beam splitters with large area for soft X-ray laser interferometer

International Nuclear Information System (INIS)

Wang Zhanshan; Zhang Zhong; Wang Fengli; Wu Wenjuan; Wang Hongchang; Qin Shuji; Chen Lingyan

2004-01-01

The soft X-ray laser Mach-Zehnder interferometer is an important tool to measure the electron densities of a laser-produced plasma near the critical surface. The design of a multilayer beam splitter at 13.9 nm for soft X-ray laser Mach-Zehnder interferometer is completed based on the standard of maximizing product of reflectivity and transmission of the beam splitter. The beam splitters which is Mo/Si multilayers on 10 mm x 10 mm area Si 3 N 4 membrane are fabricated using the magnetron sputtering. The figure error of the beam splitter has reached the deep nanometer magnitude by using optical profiler and the product of reflectivity and transmission measured by synchrotron radiation is up to to 4%. (authors)

An application of space technology to the terrestrial search for axions: the X-ray mirror telescope at CAST

Energy Technology Data Exchange (ETDEWEB)

Lutz, Gerhard E-mail: gerhard.lutz@cern.ch; Braeuninger, H.; Englhauser, J.; Hartmann, R.; Kang, D.; Kotthaus, R.; Kuster, M.; Serber, W.; Strueder, L

2004-02-01

An X-ray mirror telescope consisting of a Wolter I type mirror assembly as used in X-ray astronomy and a new type X-ray CCD has been added to the CERN Axion Solar Telescope experiment. It will strongly improve the sensitivity in the search for axions, a so far elusive particle. The axion is predicted in order to explain the observed CP conservation in strong interaction which is not expected within the generally accepted 'standard model'. Construction and performance of the X-ray telescope are described. An improvement by two orders of magnitude in the signal over background S/B event ratio is estimated.

An application of space technology to the terrestrial search for axions The X-ray mirror telescope at CAST

CERN Document Server

Lutz, Gerhard; Englhauser, J; Hartmann, R; Kang, D; Kotthaus, R; Kuster, M; Serber, W; Strüder, L

2004-01-01

An X-ray mirror telescope consisting of a Wolter I type mirror assembly as used in X-ray astronomy and a new type X-ray CCD has been added to the CERN Axion Solar Telescope experiment. It will strongly improve the sensitivity in the search for axions, a so far elusive particle. The axion is predicted in order to explain the observed CP conservation in strong interaction which is not expected within the generally accepted "standard model". Construction and performance of the X-ray telescope are described. An improvement by two orders of magnitude in the signal over background S/B event ratio is estimated.

Multilayered samples reconstructed by measuring Kα/Kβ or Lα/Lβ X-ray intensity ratios by EDXRF

Science.gov (United States)

Cesareo, Roberto; de Assis, Joaquim T.; Roldán, Clodoaldo; Bustamante, Angel D.; Brunetti, Antonio; Schiavon, Nick

2013-10-01

In this paper a general method based on energy-dispersive X-ray fluorescence (EDXRF) analysis has been tested to assess its possible use as a tool to reconstruct the structure and determine the thickness of two and/or multi-layered materials. The method utilizes the X-ray intensity ratios of Kα/Kβ or Lα/Lβ peaks (or the ratio of these peaks) for selected elements present in multi-layered objects of various materials (Au alloys, gilded Cu, gilded Ag, gilded Pb, Ag-Au Tumbaga, stone surfaces with protective treatments, Zn or Nickel plating on metals). Results show that, in the case of multi-layered samples, a correct calculation of the peak ratio (Kα /Kβ and/or Lα/Lβ) of relevant elements from energy-dispersive X-ray fluorescence spectra, can provide important information in assessing the exact location of each layer and for calculating its thickness. The methodological approach shown may have important applications not only in materials science but also when dealing with the conservation and restoration of multi-layered cultural heritage objects where the use of a Non-Destructive techniques to determine slight chemical and thickness variations in the layered structure is often of paramount importance to achieve the best results.

Thickness measurement of multilayered samples by Kα/Kβ or Lα/Lβ X-ray ratios

Energy Technology Data Exchange (ETDEWEB)

Cesareo, Roberto; Brunetti, Antonio, E-mail: roberto.cesareo@gmail.com, E-mail: brunetti@uniss.it [Universita di Sassari (UNISS), Sassari, (Italy); Assis, Joaquim T. de, E-mail: rcbarros@pq.cnpq.br [Universidade do Estado do Rio de Janeiro (UERJ), Rio de Janeiro, RJ (Brazil)

2013-07-01

Objects composed of two or more layers are relatively common among industrial and electronic materials, works of art and common tools. For example plated objects (with zinc, nickel, silver, gold) are composed of two or three layers, a painting is generally composed of several layers, a decorated vase is composed of two or three layers, just as a stone, marble or bronze covered with a protective layer. In this paper a general method and some results are described to reconstruct structure and to determine thicknesses of multilayered material, when energy dispersive X-ray fluorescence is employed to analyze the material: the X-ray ratios of Kα/Kβ and Lα/Lβ for elements present in the multilayered samples are employed. (author)

Thickness measurement of multilayered samples by Kα/Kβ or Lα/Lβ X-ray ratios

International Nuclear Information System (INIS)

Cesareo, Roberto; Brunetti, Antonio; Assis, Joaquim T. de

2013-01-01

Objects composed of two or more layers are relatively common among industrial and electronic materials, works of art and common tools. For example plated objects (with zinc, nickel, silver, gold) are composed of two or three layers, a painting is generally composed of several layers, a decorated vase is composed of two or three layers, just as a stone, marble or bronze covered with a protective layer. In this paper a general method and some results are described to reconstruct structure and to determine thicknesses of multilayered material, when energy dispersive X-ray fluorescence is employed to analyze the material: the X-ray ratios of Kα/Kβ and Lα/Lβ for elements present in the multilayered samples are employed. (author)

From x-ray telescopes to neutron scattering: Using axisymmetric mirrors to focus a neutron beam

International Nuclear Information System (INIS)

Khaykovich, B.; Gubarev, M.V.; Bagdasarova, Y.; Ramsey, B.D.; Moncton, D.E.

2011-01-01

We demonstrate neutron beam focusing by axisymmetric mirror systems based on a pair of mirrors consisting of a confocal ellipsoid and hyperboloid. Such a system, known as a Wolter mirror configuration, is commonly used in X-ray telescopes. The axisymmetric Wolter geometry allows nesting of several mirror pairs to increase collection efficiency. We implemented a system containing four nested Ni mirror pairs, which was tested by the focusing of a polychromatic neutron beam at the MIT Reactor. In addition, we have carried out extensive ray-tracing simulations of the mirrors and their performance in different situations. The major advantages of the Wolter mirrors are nesting for large angular collection and aberration-free performance. We discuss how these advantages can be utilized to benefit various neutron scattering methods, such as imaging, SANS, and time-of-flight spectroscopy.

Numerical simulation of SPH for dynamics effect of multilayer discontinuous structure irradiated by impulse X-ray

International Nuclear Information System (INIS)

Xu Binbin; Tang Wenhui; Ran Xianwen; Xu Zhihong; Chen Hua

2012-01-01

When high energy X-ray irradiates material, it will cause energy deposition in materials, and generates thermal shock wave. At present, finite difference method is used to the numerical simulation of thermal shock usually, but if considering the inter-space between the multilayer materials, the difference method will be more difficult. This paper used the SPH method to simulate multilayer discontinuous structure irradiated by high energy X-ray, and the results show that the gap between the materials of each layer has a certain influence on the thermal shock wave intensity, but doesn't have any affect to gasification impulse. (authors)

Forming mandrels for making lightweight x-ray mirrors

Science.gov (United States)

Blake, Peter N.; Saha, Timo; Zhang, William W.; O'Dell, Stephen; Kester, Thomas; Jones, William

2011-09-01

Future x-ray astronomical missions, similar to the proposed International X-ray Observatory (IXO), will utilize replicated mirrors to reduce both mass and production costs. Accurately figured and measured molds (called mandrels) - on which the mirror substrates are thermally formed, replicating the surface of the mandrels - are essential to enable these missions. The Optics Branches of the Goddard Space Flight Center (GSFC) and Marshall Space Flight Center (MSFC) have developed fabrication processes along with metrologies that yield high-precision mandrels; and through the SBIR program, they encourage small businesses to attack parts of the remaining problems. The Goddard full-aperture mandrel polisher (the MPM-500) has been developed to a level where mandrel surfaces match the 1.5 arcsec HPD level allocation in a 5 arcsec telescope program. This paper reviews this current technology and describes a pilot program to design a suite of machine tools and process parameters capable of producing many hundreds of these precision objects. A major challenge is to keep mid-spatial frequency errors below 2 nm rms - a severe specification; but we must also note the factors which work to our advantage: e.g., how the figure departs from a pure cone by only one micron, and how the demanding figure specifications which apply in the axial direction are relaxed by an order of magnitude in the azimuthal. Careful study of other large optical fabrication programs in the light of these challenges and advantages has yielded a realistic plan for the economical production of mandrels that meet program requirements in both surface and quantity.

Magnetic and structural properties of Fe/Pd multilayers studied by magnetic x-ray dichroism and x-ray absorption spectroscopy

International Nuclear Information System (INIS)

Mini, S.M.; Fullerton, E.E.; Sowers, C.H.; Fontaine, A.; Pizzini, S.; Bommannavar, A.S.; Traverse, A.; Baudelet, F.

1994-12-01

The results of magnetic circular x-ray dichroism (MCXD) measurements and extended x-ray absorption fine structure measurements (EXAFS) of the Fe K-edges of textured Fe(110)/Pd(111) multilayers are reported. The EXAFS results indicates that the iron in the system goes from bcc to a more densely packed system as the thickness of the iron layer is decreased. The magnetic properties were measured by SQUID magnetometry from 5-350 K. For all the samples, the saturation magnetization was significantly enhanced over the bulk values indicating the interface Pd atoms are polarized by the Fe layer. The enhancement corresponds to a moment of ∼2.5μ B per interface Pd atom

A high-energy x-ray microscope for inertial confinement fusion

International Nuclear Information System (INIS)

Marshall, F.J.; Bennett, G.R.

1999-01-01

We have developed a microscope capable of imaging x-ray emission from inertial confinement fusion targets in the range of 7 - 9 keV. Imaging is accomplished with a Kirkpatrick-Baez type, four-image microscope coated with a WB 4 C multilayer having a 2d period of 140 Angstrom. This microscope design (a standard used on the University of Rochester close-quote s OMEGA laser system) is capable of 5 μm resolution over a region large enough to image an imploded target (∼400 μm). This design is capable of being extended to ∼40 keV if state-of-the-art, short-spacing, multilayer coatings are used (∼25 Angstrom), and has been configured to obtain 3 μm resolution with the appropriate choice of mirror size. As such, this type of microscope could serve as a platform for multiframe, hard x-ray imaging on the National Ignition Facility. Characterization of the microscope and laboratory measurements of the energy response made with a cw x-ray source will be shown. copyright 1999 American Institute of Physics

Numerical simulation studies of the blowoff impulse induced by X-ray radiation in multilayer discontinuous material

International Nuclear Information System (INIS)

Tan Xiaoli; Ding Sheng

2010-01-01

In order to study the blowoff impulse induced by X-Ray radiation in new type compound material, the inhomogeneous reticular layers in a kind of multilayer discontinuous material were dealt with the equivalent method. So it could be simulated by method of continuum dynamics. The blowoff impulse in this material induced by irradiating of the blackbody spectral X-Ray was studied using numerical simulation method, and was compared with the result in LY-12Al. The changing discipline of the blowoff impulse along with the spectrum of X-Ray, the energy density and the type of material was analyzed. The main conclusions are: (1) the characteristic of energy deposition in material deciding by the spectrum of X-Ray is the ultimate cause of the magnitude of blowoff impulse; (2) for same spectrum and same material, higher energy density will cause more blowoff impulse, but the coupling coefficient of blowoff impulse is almost constant; (3) for same loading, the coupling coefficient of blowoff impulse of multilayer discontinuous material is bigger than that of LY-12Al. (authors)

Multilayer Laue Lens: A Path Toward One Nanometer X-Ray Focusing

International Nuclear Information System (INIS)

Yan, H.; Stephenson, G.B.; Maser, J.; Yan, H.; Conley, R.; Kang, H.C.; Stephenson, G.B.; Kang, H.C.; Maser, J.; Conley, R.; Liu, Ch.; Macrander, A.T.

2010-01-01

The multilayer Laue lens (MLL) is a novel diffractive optic for hard X-ray nano focusing, which is fabricated by thin film deposition techniques and takes advantage of the dynamical diffraction effect to achieve a high numerical aperture and efficiency. It overcomes two difficulties encountered in diffractive optics fabrication for focusing hard X-rays: (1) small outmost zone width and (2) high aspect ratio. Here, we will give a review on types, modeling approaches, properties, fabrication, and characterization methods of MLL optics. We show that a full-wave dynamical diffraction theory has been developed to describe the dynamical diffraction property of the MLL and has been employed to design the optimal shapes for nano focusing. We also show a 16 nm line focus obtained by a partial MLL and several characterization methods. Experimental results show a good agreement with the theoretical calculations. With the continuing development of MLL optics, we believe that an MLL-based hard x-ray microscope with true nanometer resolution is on the horizon

Very high resolution UV and X-ray spectroscopy and imagery of solar active regions

Science.gov (United States)

Bruner, M.; Brown, W. A.; Haisch, B. M.

1987-01-01

A scientific investigation of the physics of the solar atmosphere, which uses the techniques of high resolution soft X-ray spectroscopy and high resolution UV imagery, is described. The experiments were conducted during a series of three sounding rocket flights. All three flights yielded excellent images in the UV range, showing unprecedented spatial resolution. The second flight recorded the X-ray spectrum of a solar flare, and the third that of an active region. A normal incidence multi-layer mirror was used during the third flight to make the first astronomical X-ray observations using this new technique.

Mathematical Formalism for Designing Wide-Field X-Ray Telescopes: Mirror Nodal Positions and Detector Tilts

Science.gov (United States)

Elsner, R. F.; O'Dell, S. L.; Ramsey, B. D.; Weisskopf, M. C.

2011-01-01

We provide a mathematical formalism for optimizing the mirror nodal positions along the optical axis and the tilt of a commonly employed detector configuration at the focus of a x-ray telescope consisting of nested mirror shells with known mirror surface prescriptions. We adopt the spatial resolution averaged over the field-of-view as the figure of merit M. A more complete description appears in our paper in these proceedings.

X-ray laser interferometry: A new tool for AGEX

International Nuclear Information System (INIS)

Wan, A.S.; Moreno, J.C.; Libby, S.B.

1995-10-01

Collisionally pumped soft x-ray lasers now operate over a wavelength range extending from 4--40 nm. With the recent advances in the development of multilayer mirrors and beamsplitters in the soft x-ray regime, we can utilize the unique properties of x-ray lasers to study large, rapidly evolving laser-driven plasmas with high electron densities. By employing a shorter wavelength x-ray laser, as compared to using conventional optical laser as the probe source, we can access a much higher density regime while reducing refractive effects which limit the spatial resolution and data interpretation. Using a neon-like yttrium x-ray laser which operates at a wavelength of 15.5 mn, we have performed a series of soft x-ray laser interferometry experiments, operated in the skewed Mach-Zehnder configuration, to characterize plasmas relevant to both weapons and inertial confinement fusion. The two-dimensional density profiles obtained from the interferograms allow us to validate and benchmark our numerical models used to study the physics in the high-energy density regime, relevant to both weapons and inertial confinement fusion

Feasibility of X-ray analysis of multi-layer thin films at a single beam voltage

International Nuclear Information System (INIS)

Statham, P J

2010-01-01

Multi-layer analysis using electron beam excitation and X-ray spectrometry is a powerful tool for characterising layers down to 1 nm thickness and with typically 1 μm lateral resolution but does not always work. Most published applications have used WDS with many measurements at different beam voltages and considerable experience has been needed to choose lines and voltages particularly for complex multi-layer problems. A new objective mathematical approach is described which demonstrates whether X-ray analysis can obtain reliable results for an arbitrary multi-layer problem. A new algorithm embodied in 'ThinFilmID' software produces a single plot that shows feasibility of achieving results with a single EDS spectrum and suggests the optimal beam voltage. Synthesis of EDS spectra allows the precision in results to be estimated and acquisition conditions modified before wasting valuable instrument time. Thus, practicality of multi-layer thin film analysis at a single beam voltage can now be established without the extensive experimentation that was previously required by a microanalysis expert. Examples are shown where the algorithm discovers viable single-voltage conditions for applications that experts previously thought could only be addressed using measurements at more than one beam voltage.

Manufacturing method for hard x-ray focusing mirrors with ellipsoidal surface

International Nuclear Information System (INIS)

Yumoto, Hirokatsu; Koyama, Takahisa; Ohashi, Haruhiko; Matsuyama, Satoshi; Yamauchi, Kazuto

2014-01-01

The aim of this study is to establishing the manufacturing method for hard x-ray nano-focusing mirrors with ellipsoidal surface. Ellipsoidal mirror optics, which can produce point focus with a mirror, has a noticeable feature of a high focusing efficiency, although an ultra-precise surface figure with an accuracy of a few nanometers is required for nano-focusing mirrors. Here, we examined the effectiveness of the manufacturing process for ellipsoidal mirrors, which is consisted of a precision grinding process, a removal process of surface roughness, and a computer-controlled shape correction. The precision processing machine for both a removal of surface roughness and a shape correction was developed. This validated the utility of removing surface roughness with a spatial wavelength of 40 μm, which is the tool mark of the grinding process. The developed process achieved the improvement of surface roughness from 1.6 nm to 0.1 nm (RMS), and the figure correction with a high accuracy of < 10 nm and a spatial resolution of < 2 mm. (author)

Measurement of the point spread function and effective area of the Solar-A Soft X-ray Telescope mirror

Science.gov (United States)

Lemen, J. R.; Claflin, E. S.; Brown, W. A.; Bruner, M. E.; Catura, R. C.

1989-01-01

A grazing incidence solar X-ray telescope, Soft X-ray Telescope (SXT), will be flown on the Solar-A satellite in 1991. Measurements have been conducted to determine the focal length, Point Spread Function (PSF), and effective area of the SXT mirror. The measurements were made with pinholes, knife edges, a CCD, and a proportional counter. The results show the 1/r character of the PSF, and indicate a half power diameter of 4.9 arcsec and an effective area of 1.33 sq cm at 13.3 A (0.93 keV). The mirror was found to provide a high contrast image with very little X-ray scattering.

Variable magnification with Kirkpatrick-Baez optics for synchrotron x-ray microscopy

OpenAIRE

Jach, T.; Bakulin, A. S.; Durbin, S. M.; Pedulla, J.; Macrander, A.

2006-01-01

We describe the distinction between the operation of a short focal length x-ray microscope forming a real image with a laboratory source (convergent illumination) and with a highly collimated intense beam from a synchrotron light source (Kohler illumination). We demonstrate the distinction with a Kirkpatrick-Baez microscope consisting of short focal length multilayer mirrors operating at an energy of 8 keV. In add...

Correcting X-ray spectra obtained from the AXAF VETA-I mirror calibration for pileup, continuum, background and deadtime

Science.gov (United States)

Chartas, G.; Flanagan, K.; Hughes, J. P.; Kellogg, E. M.; Nguyen, D.; Zombek, M.; Joy, M.; Kolodziejezak, J.

1993-01-01

The VETA-I mirror was calibrated with the use of a collimated soft X-ray source produced by electron bombardment of various anode materials. The FWHM, effective area and encircled energy were measured with the use of proportional counters that were scanned with a set of circular apertures. The pulsers from the proportional counters were sent through a multichannel analyzer that produced a pulse height spectrum. In order to characterize the properties of the mirror at different discrete photon energies one desires to extract from the pulse height distribution only those photons that originated from the characteristic line emission of the X-ray target source. We have developed a code that fits a modeled spectrum to the observed X-ray data, extracts the counts that originated from the line emission, and estimates the error in these counts. The function that is fitted to the X-ray spectra includes a Prescott function for the resolution of the detector a second Prescott function for a pileup peak and a X-ray continuum function. The continuum component is determined by calculating the absorption of the target Bremsstrahlung through various filters, correcting for the reflectivity of the mirror and convolving with the detector response.

Substrate and coating defect planarization strategies for high-laser-fluence multilayer mirrors

International Nuclear Information System (INIS)

Stolz, Christopher J.; Wolfe, Justin E.; Mirkarimi, Paul B.; Folta, James A.; Adams, John J.; Menor, Marlon G.; Teslich, Nick E.; Soufli, Regina; Menoni, Carmen S.; Patel, Dinesh

2015-01-01

Planarizing or smoothing over nodular defects in multilayer mirrors can be accomplished by a discrete deposit-and-etch process that exploits the angle-dependent etching rate of optical materials. Typically, nodular defects limit the fluence on mirrors irradiated at 1064 nm with 10 ns pulse lengths due to geometrically- and interference-induced light intensification. Planarized hafina/silica multilayer mirrors have demonstrated > 125 J/cm 2 laser resistance for single-shot testing and 50 J/cm 2 for multi-shot testing for nodular defects originating on the substrate surface. Two planarization methods were explored: thick planarization layers on the substrate surface and planarized silica layers throughout the multilayer in which only the silica layers that are below one half of the incoming electric field value are etched. This paper also describes the impact of planarized defects that are buried within the multilayer structure compared to planarized substrate particulate defects. - Highlights: • Defect planarization significantly improves multilayer mirror laser resistance • Substrate and coating defects have both been effectively planarized • Single and multishot laser resistance improvement was demonstrated

A high-quality multilayer structure characterization method based on X-ray fluorescence and Monte Carlo simulation

Energy Technology Data Exchange (ETDEWEB)

Brunetti, Antonio; Golosio, Bruno [Universita degli Studi di Sassari, Dipartimento di Scienze Politiche, Scienze della Comunicazione e Ingegneria dell' Informazione, Sassari (Italy); Melis, Maria Grazia [Universita degli Studi di Sassari, Dipartimento di Storia, Scienze dell' Uomo e della Formazione, Sassari (Italy); Mura, Stefania [Universita degli Studi di Sassari, Dipartimento di Agraria e Nucleo di Ricerca sulla Desertificazione, Sassari (Italy)

2014-11-08

X-ray fluorescence (XRF) is a well known nondestructive technique. It is also applied to multilayer characterization, due to its possibility of estimating both composition and thickness of the layers. Several kinds of cultural heritage samples can be considered as a complex multilayer, such as paintings or decorated objects or some types of metallic samples. Furthermore, they often have rough surfaces and this makes a precise determination of the structure and composition harder. The standard quantitative XRF approach does not take into account this aspect. In this paper, we propose a novel approach based on a combined use of X-ray measurements performed with a polychromatic beam and Monte Carlo simulations. All the information contained in an X-ray spectrum is used. This approach allows obtaining a very good estimation of the sample contents both in terms of chemical elements and material thickness, and in this sense, represents an improvement of the possibility of XRF measurements. Some examples will be examined and discussed. (orig.)

A high-quality multilayer structure characterization method based on X-ray fluorescence and Monte Carlo simulation

International Nuclear Information System (INIS)

Brunetti, Antonio; Golosio, Bruno; Melis, Maria Grazia; Mura, Stefania

2015-01-01

X-ray fluorescence (XRF) is a well known nondestructive technique. It is also applied to multilayer characterization, due to its possibility of estimating both composition and thickness of the layers. Several kinds of cultural heritage samples can be considered as a complex multilayer, such as paintings or decorated objects or some types of metallic samples. Furthermore, they often have rough surfaces and this makes a precise determination of the structure and composition harder. The standard quantitative XRF approach does not take into account this aspect. In this paper, we propose a novel approach based on a combined use of X-ray measurements performed with a polychromatic beam and Monte Carlo simulations. All the information contained in an X-ray spectrum is used. This approach allows obtaining a very good estimation of the sample contents both in terms of chemical elements and material thickness, and in this sense, represents an improvement of the possibility of XRF measurements. Some examples will be examined and discussed. (orig.)

Nano-metrology: The art of measuring X-ray mirrors with slope errors <100 nrad

Energy Technology Data Exchange (ETDEWEB)

Alcock, Simon G., E-mail: simon.alcock@diamond.ac.uk; Nistea, Ioana; Sawhney, Kawal [Diamond Light Source Ltd., Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE (United Kingdom)

2016-05-15

We present a comprehensive investigation of the systematic and random errors of the nano-metrology instruments used to characterize synchrotron X-ray optics at Diamond Light Source. With experimental skill and careful analysis, we show that these instruments used in combination are capable of measuring state-of-the-art X-ray mirrors. Examples are provided of how Diamond metrology data have helped to achieve slope errors of <100 nrad for optical systems installed on synchrotron beamlines, including: iterative correction of substrates using ion beam figuring and optimal clamping of monochromator grating blanks in their holders. Simulations demonstrate how random noise from the Diamond-NOM’s autocollimator adds into the overall measured value of the mirror’s slope error, and thus predict how many averaged scans are required to accurately characterize different grades of mirror.

Nano-metrology: The art of measuring X-ray mirrors with slope errors <100 nrad

International Nuclear Information System (INIS)

Alcock, Simon G.; Nistea, Ioana; Sawhney, Kawal

2016-01-01

We present a comprehensive investigation of the systematic and random errors of the nano-metrology instruments used to characterize synchrotron X-ray optics at Diamond Light Source. With experimental skill and careful analysis, we show that these instruments used in combination are capable of measuring state-of-the-art X-ray mirrors. Examples are provided of how Diamond metrology data have helped to achieve slope errors of <100 nrad for optical systems installed on synchrotron beamlines, including: iterative correction of substrates using ion beam figuring and optimal clamping of monochromator grating blanks in their holders. Simulations demonstrate how random noise from the Diamond-NOM’s autocollimator adds into the overall measured value of the mirror’s slope error, and thus predict how many averaged scans are required to accurately characterize different grades of mirror.

Transition radiation in metal-metal multilayer nanostructures as a medical source of hard x-ray radiation

International Nuclear Information System (INIS)

Pokrovsky, A. L.; Kaplan, A. E.; Shkolnikov, P. L.

2006-01-01

We show that a periodic metal-metal multilayer nanostructure can serve as an efficient source of hard x-ray transition radiation. Our research effort is aimed at developing an x-ray source for medical applications, which is based on using low-energy relativistic electrons. The approach toward choosing radiator-spacer couples for the generation of hard x-ray resonant transition radiation by few-MeV electrons traversing solid multilayer structures for the energies of interest to medicine (30-50 keV) changes dramatically compared with that for soft x-ray radiation. We show that one of the main factors in achieving the required resonant line is the absence of the contrast of the refractive indices between the spacer and the radiator at the far wings of the radiation line; for that purpose, the optimal spacer, as a rule, should have a higher atomic number than the radiator. Having experimental goals in mind, we have considered also the unwanted effects due to bremsstrahlung radiation, absorption and scattering of radiated photons, detector-related issues, and inhibited coherence of transition radiation due to random deviation of spacing between the layers. Choosing as a model example a Mo-Ag radiator-spacer pair of materials, we demonstrate that the x-ray transition radiation line can be well resolved with the use of spatial and frequency filtering

The X-ray mirror telescope and the pn-CCD detector of CAST

CERN Document Server

Kuster, M; Englhauser, J; Franz, J; Friedrich, P; Hartmann, R; Kang, D; Kotthaus, R; Lutz, Gerhard; Moralez, J; Serber, W; Strüder, L

2004-01-01

The Cern Axion Solar Telescope - CAST - uses a prototype 9 Tesla LHC superconducting dipole magnet to search for a hypothetical pseudoscalar particle, the axion, which was proposed by theory in the 1980s to solve the strong CP problem and which could be a dark matter candidate. In CAST a strong magnetic field is used to convert the solar axions to detectable photons via inverse Primakoff effect. The resulting X-rays are thermally distributed in the energy range of 1-7 keV and can be observed with conventional X-ray detectors. The most sensitive detector system of CAST is a pn-CCD detector originally developed for XMM-Newton combined with a Wolter I type X-ray mirror system. The combination of a focusing X-ray optics and a state of the art pn-CCD detector which combines high quantum efficiency, good spacial and energy resolution, and low background improves the sensitivity of the CAST experiment such that for the first time the axion photon coupling constant can be probed beyond the best astrophysical constrai...

The STAR-X X-Ray Telescope Assembly (XTA)

Science.gov (United States)

McClelland, Ryan S.; Bautz, Mark W.; Bonafede, Joseph A.; Miller, Eric D.; Saha, Timo T.; Solly, Peter M.; Zhang, William W.

2017-01-01

The Survey and Time-domain Astrophysical Research eXplorer (STAR-X) science goals are to discover what powers the most violent explosions in the Universe, understand how black holes grow across cosmic time and mass scale, and measure how structure formation heats the majority of baryons in the Universe. To achieve these goals, STAR-X requires a powerful X-ray telescope with a large field of view, large collecting area, and excellent point spread function. The STAR-X instrument, the X-Ray Telescope Assembly (XTA), meets these requirements using a powerful X-ray mirror technology based on precision-polished single crystal silicon and a mature CCD detector technology. The XTA is composed of three major subsystems: an X-ray Mirror Assembly (MA) of high resolution, lightweight mirror segments fabricated out of single crystal silicon; a Focal Plane Assembly (FPA) made of back-illuminated CCD's capable of detecting X-rays with excellent quantum efficiency; and a composite Telescope Tube that structurally links the MA and FPA. The MA consists of 5,972 silicon mirror segments mounted into five subassemblies called meta-shells. A meta-shell is constructed from an annular central structural shell covered with interlocking layers of mirror segments. This paper describes the requirements, design, and analysis of the XTA subsystems with particular focus on the MA.

Very high resolution UV and x-ray spectroscopy and imagery of solar active regions. Final report

International Nuclear Information System (INIS)

Bruner, M.; Brown, W.A.; Haisch, B.M.

1987-01-01

A scientific investigation of the physics of the solar atmosphere, which uses the techniques of high resolution soft x-ray spectroscopy and high resolution UV imagery, is described. The experiments were conducted during a series of three sounding rocket flights. All three flights yielded excellent images in the UV range, showing unprecedented spatial resolution. The second flight recorded the x-ray spectrum of a solar flare, and the third that of an active region. A normal incidence multi-layer mirror was used during the third flight to make the first astronomical x-ray observations using this new technique

Growth, structure, and performance of depth-graded W/Si multilayers for hard x-ray optics

DEFF Research Database (Denmark)

Windt, D.L.; Christensen, Finn Erland; Craig, W.W.

2000-01-01

that the dominant interface imperfection in these films is interfacial diffuseness; interfacial roughness is minimal (sigma(r)similar to 0.175 nm) in structures prepared under optimal conditions, but can increase under conditions in which the beneficial effects of energetic bombardment during growth are compromised......-graded W/Si multilayer structures, and high-resolution transmission electron microscopy (TEM) and selected area electron diffraction (SAED) to characterize the interface structure and layer morphology as a function of depth in an optimized depth-graded multilayer. From x-ray analysis we find interface......), and somewhat larger interface widths (i.e., sigma=0.35-0.4 nm) for structures grown at higher Ar pressures, higher background pressures, or with larger target-to-substrate distances. We find no variation in interface widths with magnetron power. Nonspecular x-ray reflectance analysis and TEM suggest...

Multilayers quantitative X-ray fluorescence analysis applied to easel paintings.

Science.gov (United States)

de Viguerie, Laurence; Sole, V Armando; Walter, Philippe

2009-12-01

X-ray fluorescence spectrometry (XRF) allows a rapid and simple determination of the elemental composition of a material. As a non-destructive tool, it has been extensively used for analysis in art and archaeology since the early 1970s. Whereas it is commonly used for qualitative analysis, recent efforts have been made to develop quantitative treatment even with portable systems. However, the interpretation of the results obtained with this technique can turn out to be problematic in the case of layered structures such as easel paintings. The use of differential X-ray attenuation enables modelling of the various layers: indeed, the absorption of X-rays through different layers will result in modification of intensity ratio between the different characteristic lines. This work focuses on the possibility to use XRF with the fundamental parameters method to reconstruct the composition and thickness of the layers. This method was tested on several multilayers standards and gives a maximum error of 15% for thicknesses and errors of 10% for concentrations. On a painting test sample that was rather inhomogeneous, the XRF analysis provides an average value. This method was applied in situ to estimate the thickness of the layers a painting from Marco d'Oggiono, pupil of Leonardo da Vinci.

Recent Developments in the X-Ray Reflectivity Analysis for Rough Surfaces and Interfaces of Multilayered Thin Film Materials

Directory of Open Access Journals (Sweden)

Yoshikazu Fujii

2013-01-01

Full Text Available X-ray reflectometry is a powerful tool for investigations on rough surface and interface structures of multilayered thin film materials. The X-ray reflectivity has been calculated based on the Parratt formalism, accounting for the effect of roughness by the theory of Nevot-Croce conventionally. However, in previous studies, the calculations of the X-ray reflectivity often show a strange effect where interference effects would increase at a rough surface. And estimated surface and interface roughnesses from the X-ray reflectivity measurements did not correspond to the TEM image observation results. The strange result had its origin in a used equation due to a serious mistake in which the Fresnel transmission coefficient in the reflectivity equation is increased at a rough interface because of a lack of consideration of diffuse scattering. In this review, a new accurate formalism that corrects this mistake is presented. The new accurate formalism derives an accurate analysis of the X-ray reflectivity from a multilayer surface of thin film materials, taking into account the effect of roughness-induced diffuse scattering. The calculated reflectivity by this accurate reflectivity equation should enable the structure of buried interfaces to be analyzed more accurately.

Nanometer Linear Focusing of Hard X Rays by a Multilayer Laue Lens

International Nuclear Information System (INIS)

Kang, H.C.; Stephenson, G.B.; Maser, J.; Liu, C.; Conley, R.; Macrander, A.T.; Vogt, S.

2006-01-01

We report on a type of linear zone plate for nanometer-scale focusing of hard x rays, a multilayer Laue lens (MLL), produced by sectioning a multilayer and illuminating it in Laue diffraction geometry. Because of its large optical depth, a MLL spans the diffraction regimes applicable to a thin Fresnel zone plate and a crystal. Coupled wave theory calculations indicate that focusing to 5 nm or smaller with high efficiency should be possible. Partial MLL structures with outermost zone widths as small as 10 nm have been fabricated and tested with 19.5 keV synchrotron radiation. Focal sizes as small as 30 nm with efficiencies up to 44% are measured

Full Multilayer Laue Lens for Focusing Hard X-rays

International Nuclear Information System (INIS)

Liu Chian; Shi, B.; Qian, J.; Conley, R.; Yan, H.; Wieczorek, M.; Macrander, A. T.; Maser, J.; Stephenson, G. B.

2010-01-01

Multilayer Laue Lenses (MLLs) were developed by us using dynamic diffraction effects to efficiently focus hard x-rays to very small spots. Using a partial MLL we were able to focus 19.5-keV hard x-rays to a line focus of 16 nm with an efficiency of 31%. A full MLL is a complete linear MLL structure. It can be fabricated by bonding two partial MLL wafers, or by growing the full structure using magnetron sputtering without bonding. A 40-μm full MLL, with a total of 5166 layers of WSi 2 and Si, has been successfully grown by sputter deposition. The layer thicknesses gradually vary from 4 nm to ∼400 nm and then back to 4 nm. Two coating runs were used to grow the full structure, one for each half. It took over 56 h for each run. A 100-μm nearly-full MLL was constructed by bonding. Each 50-μm half-structure has 1788 WSi 2 and Si layers with 12-nm to ∼32-nm thicknesses and ∼32-μm total thickness, followed by a thick WSi 2 layer of ∼17 μm, and an AuSn layer of ∼1 μm. Both full MLL structures survived dicing and polishing. The primary results demonstrate the feasibility and potential of a full MLL with a doubled numerical aperture and large beam acceptance for hard x-rays.

Nitridation and contrast of B4C/La interfaces and X-ray multilayer optics

NARCIS (Netherlands)

Tsarfati, T.; van de Kruijs, Robbert Wilhelmus Elisabeth; Zoethout, E.; Bijkerk, Frederik

2010-01-01

Chemical diffusion and interlayer formation in thin layers and at interfaces is of increasing influence in nanoscopic devices such as nano-electronics, magneto-optical storage and multilayer X-ray optics. We show that with the nitridation of reactive B4C/La interfaces, both the chemical and optical

Toward Adaptive X-Ray Telescopes

Science.gov (United States)

O'Dell, Stephen L.; Atkins, Carolyn; Button, Tim W.; Cotroneo, Vincenzo; Davis, William N.; Doel, Peer; Feldman, Charlotte H.; Freeman, Mark D.; Gubarev, Mikhail V.; Kolodziejczak, Jeffrey J.;

Large aperture Fizeau interferometer commissioning and preliminary measurements of a long x-ray mirror at European X-ray Free Electron Laser

Energy Technology Data Exchange (ETDEWEB)

Vannoni, M., E-mail: maurizio.vannoni@xfel.eu; Freijo Martín, I. [European XFEL GmbH, Albert-Einstein-Ring 19, 22761 Hamburg (Germany)

2016-05-15

The European XFEL (X-ray Free Electron Laser) is a large facility under construction in Hamburg, Germany. It will provide a transversally fully coherent x-ray radiation with outstanding characteristics: high repetition rate (up to 2700 pulses with a 0.6 ms long pulse train at 10 Hz), short wavelength (down to 0.05 nm), short pulse (in the femtoseconds scale), and high average brilliance (1.6 ⋅ 10{sup 25} (photons s{sup −1} mm{sup −2} mrad{sup −2})/0.1% bandwidth). The beam has very high pulse energy; therefore, it has to be spread out on a relatively long mirror (about 1 m). Due to the very short wavelength, the mirrors need to have a high quality surface on their entire length, and this is considered very challenging even with the most advanced polishing methods. In order to measure the mirrors and to characterize their interaction with the mechanical mount, we equipped a metrology laboratory with a large aperture Fizeau interferometer. The system is a classical 100 mm diameter commercial Fizeau, with an additional expander providing a 300 mm diameter beam. Despite the commercial nature of the system, special care has been taken in the polishing of the reference flats and in the expander quality. We report the first commissioning of the instrument, its calibration, and performance characterization, together with some preliminary results with the measurement of a 950 mm silicon substrate. The intended application is to characterize the final XFEL mirrors with nanometer accuracy.

Optical Analysis of an Ultra-High resolution Two-Mirror Soft X-Ray Microscope

Science.gov (United States)

Shealy, David L.; Wang, Cheng; Hoover, Richard B.

1994-01-01

This work has summarized for a Schwarzschild microscope some relationships between numerical aperture (NA), magnification, diameter of the primary mirror, radius of curvature of the secondary mirror, and the total length of the microscope. To achieve resolutions better than a spherical Schwarzschild microscope of 3.3 Lambda for a perfectly aligned and fabricated system. it is necessary to use aspherical surfaces to control higher-order aberrations. For an NA of 0.35, the aspherical Head microscope provides diffraction limited resolution of 1.4 Lambda where the aspherical surfaces differ from the best fit spherical surface by approximately 1 micrometer. However, the angle of incidence varies significantly over the primary and the secondary mirrors, which will require graded multilayer coatings to operate near peak reflectivities. For higher numerical apertures, the variation of the angle of incidence over the secondary mirror surface becomes a serious problem which must be solved before multilayer coatings can be used for this application. Tolerance analysis of the spherical Schwarzschild microscope has shown that water window operations will require 2-3 times tighter tolerances to achieve a similar performance for operations with 130 A radiation. Surface contour errors have been shown to have a significant impact on the MTF and must be controlled to a peak-to-valley variation of 50-100 A and a frequency of 8 periods over the surface of a mirror.

Angular and energy dependence of ion bombardment of Mo/Si multilayers

DEFF Research Database (Denmark)

Voorma, H.J.; Louis, E.; Bijkerk, F.

1997-01-01

The process of ion bombardment is investigated for the fabrication of Mo/Si multilayer x-ray mirrors using e-beam evaporation. The ion treatment is applied immediately after deposition of each of the Si layers to smoothen the layers by removing an additional thickness of the Si layer. In this stu......, the angular dependence of the etch yield, obtained from the in situ reflectivity measurements, is investigated in order o determine the optimal ion beam parameters for the production of multilayer mirrors on curved substrates....

Soft X-ray magnetic scattering study of rotational magnetisation processes in cobalt/copper multilayers

International Nuclear Information System (INIS)

Hase, T.P.A.; Fulthorpe, B.D.; Wilkins, S.B.; Tanner, B.K.; Marrows, C.H.; Hickey, B.J.

2001-01-01

We report the observation of magnetic viscosity in the intensity of resonant magnetic soft X-ray scattering during rotational magnetisation processes in antiferromagnetically coupled Co/Cu multilayers. The hysteretic time-dependent component of the signal can be fitted to a single-exponential function that varies as a function of magnetising field

Metal location and thickness in a multilayered sheet by measuring Kα/Kβ, Lα/Lβ and Lα/Lγ X-ray ratios

International Nuclear Information System (INIS)

Cesareo, Roberto; Rizzutto, Marcia A.; Brunetti, Antonio; Rao, Donepudi V.

2009-01-01

When a multilayered material is analyzed by means of energy-dispersive X-ray fluorescence analysis, then the X-ray ratios of Kα/Kβ, or Lα/Lβ and Lα/Lγ, for an element in the multilayered material, depend on the composition and thickness of the layer in which the element is situated, and on the composition and thickness of the superimposed layer (or layers). Multilayered samples are common in archaeometry, for example, in the case of pigment layers in paintings, or in the case of gilded or silvered alloys. The latter situation is examined in detail in the present paper, with a specific reference to pre-Columbian alloys from various museums in the north of Peru.

Lasers, extreme UV and soft X-ray

Energy Technology Data Exchange (ETDEWEB)

Nilsen, Joseph [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)

2015-09-20

Three decades ago, large ICF lasers that occupied entire buildings were used as the energy sources to drive the first X-ray lasers. Today X-ray lasers are tabletop, spatially coherent, high-repetition rate lasers that enable many of the standard optical techniques such as interferometry to be extended to the soft X-ray regime between wavelengths of 10 and 50 nm. Over the last decade X-ray laser performance has been improved by the use of the grazing incidence geometry, diode-pumped solid-state lasers, and seeding techniques. The dominant X-ray laser schemes are the monopole collisional excitation lasers either driven by chirped pulse amplification (CPA) laser systems or capillary discharge. The CPA systems drive lasing in neon-like or nickel-like ions, typically in the 10 – 30 nm range, while the capillary system works best for neon-like argon at 46.9 nm. Most researchers use nickel-like ion lasers near 14 nm because they are well matched to the Mo:Si multilayer mirrors that have peak reflectivity near 13 nm and are used in many applications. As a result, the last decade has seen the birth of the X-ray free electron laser (XFEL) that can reach wavelengths down to 0.15 nm and the inner-shell Ne laser at 1.46 nm.

An imitative calculation of W/C, Mo/Si articifial multilayered films' structures and properties as X-ray monochromators

International Nuclear Information System (INIS)

Liu Wen; Liu Wenhan; Wu Ziqin

1989-01-01

An imitative calculation on W/C and Mo/Si artificial multilayered films have been made. The influences of total period numbers and deviation of period thickness on X-ray diffraction peak were given. Two difference diviations, random fluctuation and system linear deviation have been imitated, their influences on X-ray energy distinguish power have been compared

Ordering phenomena in FeCo-films and Fe/Cr-multilayers: an X-ray and neutron scattering study

Energy Technology Data Exchange (ETDEWEB)

Nickel, B.

2001-07-01

The following topics are covered: critical phenomena in thin films, critical adsorption, finite size scaling, FeCo Ising model, kinematical scattering theory for thin films, FeCo thin films, growth and characterisation of single crystal FeCo thin films, X-ray study of ordering in FeCo films, antiferromagnetic coupling in Fe/Cr multilayers, neutron scattering on Fe/Cr multilayers (WL)

Multilayer beam splitter used in a soft X-ray Mach-Zehnder interferometer at working wavelength of 13.9 nm

International Nuclear Information System (INIS)

Zhang Zhong; Wang Zhanshan; Wang Hongchang; Wang Fengli; Wu Wenjuan; Zhang Shumin; Qin Shuji; Chen Lingyan

2006-01-01

The soft X-ray Mach-Zehnder interferometer is an important tool in measuring the electron densities of laser-produced plasma near the critical surface. The design, fabrication and characterization of multilayer beam splitters at 13.9 nm for soft X-ray Mach-Zehnder interferometer are presented in the paper. The design of beam splitter is completed based on the standard of maximizing product of reflectivity and transmission of the beam splitter at 13.9 nm. The beam splitters, which are Mo/Si multi-layer deposited on 10 mm x 10 mm area, 100 nm thickness Si 3 N 4 membranes, are fabricated using the magnetron sputtering. A method based on extended He-Ne laser beam is developed to analyze the figure error of the beam splitters. The data measured by an optical profiler prove that the method based on visible light is effective to analyze the figure of the beam splitters. The rms figure error of a beam splitter reaches 1.757 nm in the center area 3.82 mm x 3.46 mm and satisfies the need of soft X-ray interference experiment. The product of reflectivity and transmission measured by synchrotron radiation is near to 4%. The Mach-Zehnder interferometer at 13.9 nm based on the multilayer beam splitters is used in 13.9 nm soft X-ray laser interference experiment, in which a clear interferograms of C 8 H 8 laser-produced plasma is got. (authors)

High resolution x-ray microscope

OpenAIRE

Gary, C. K.; Park, H.; Lombardo, L. W.; Piestrup, M. A.; Cremer, J. T.; Pantell, R. H.; Dudchik, Y. I.

2007-01-01

The authors present x-ray images of grid meshes and biological material obtained using a microspot x-ray tube with a multilayer optic and a 92-element parabolic compound refractive lens CRL made of a plastic containing only hydrogen and carbon. Images obtained using this apparatus are compared with those using an area source with a spherical lens and a spherical lens with multilayer condenser. The authors found the best image quality using the multilayer condenser with a parabolic lens, com...

X-ray refractive index: A tool to determine the average composition in multilayer structures

International Nuclear Information System (INIS)

Miceli, P.F.; Neumann, D.A.; Zabel, H.

1986-01-01

We present a novel and simple method to determine the average composition of multilayers and superlattices by measuring the x-ray refractive index. Since these modulated structures exhibit Bragg reflections at small angles, by using a triple axis x-ray spectrometer we have accurately determined the peak shifts due to refraction in GaAs/Al/sub x/Ga/sub 1-x/As and Nb/Ta superlattices. Knowledge of the refractive index provides the average fractional composition of the periodic structure since the refractive index is a superposition of the refractive indices of the atomic constituents. We also present a critical discussion of the method and compare the values of the average fractional composition obtained in this manner to the values obtained from the lattice parameter change in the GaAs/Al/sub x/Ga/sub 1-x/As superlattices due to the Al

Optical properties of boron carbide near the boron K edge evaluated by soft-x-ray reflectometry from a Ru/B4C multilayer

Energy Technology Data Exchange (ETDEWEB)

Ksenzov, Dmitriy; Panzner, Tobias; Schlemper, Christoph; Morawe, Christian; Pietsch, Ullrich

2009-12-10

Soft-x-ray Bragg reflection from two Ru/B4C multilayers with 10 and 63 periods was used for independent determination of both real and imaginary parts of the refractive index n = 1 -{delta} + i{beta} close to the boron K edge ({approx}188 eV). Prior to soft x-ray measurements, the structural parameters of the multilayers were determined by x-ray reflectometry using hard x rays. For the 63-period sample, the optical properties based on the predictions made for elemental boron major deviations were found close to the K edge of boron for the 10-period sample explained by chemical bonding of boron to B4C and various boron oxides.

Subgroup report on hard x-ray microprobes

International Nuclear Information System (INIS)

Ice, G.E.; Barbee, T.; Bionta, R.; Howells, M.; Thompson, A.C.; Yun, W.

1994-01-01

The increasing availability of synchrotron x-ray sources has stimulated the development of advanced hard x-ray (E≥5 keV) microprobes. New x-ray optics have been demonstrated which show promise for achieving intense submicron hard x-ray probes. These probes will be used for extraordinary elemental detection by x-ray fluorescence/absorption and for microdiffraction to identify phase and strain. The inherent elemental and crystallographic sensitivity of an x-ray microprobe and its inherently nondestructive and penetrating nature makes the development of an advanced hard x-ray microprobe an important national goal. In this workshop state-of-the-art hard x-ray microprobe optics were described and future directions were discussed. Gene Ice, Oak Ridge National Laboratory (ORNL), presented an overview of the current status of hard x-ray microprobe optics and described the use of crystal spectrometers to improve minimum detectable limits in fluorescent microprobe experiments. Al Thompson, Lawrence Berkeley Laboratory (LBL), described work at the Center for X-ray Optics to develop a hard x-ray microprobe based on Kirkpatrick-Baez (KB) optics. Al Thompson also showed the results of some experimental measurements with their KB optics. Malcolm Howells presented a method for bending elliptical mirrors and Troy Barbee commented on the use of graded d spacings to achieve highest efficiency in KB multilayer microfocusing. Richard Bionta, Lawrence Livermore National Laboratory (LLNL), described the development of the first hard x-ray zone plates and future promise of so called open-quotes jelly rollclose quotes or sputter slice zone plates. Wenbing Yun, Argonne National Laboratory (ANL), described characterization of jelly roll and lithographically produced zone plates and described the application of zone plates to focus extremely narrow bandwidths by nuclear resonance. This report summarizes the presentations of the workshop subgroup on hard x-ray microprobes

Efficient 'water window' soft x-ray high-Z plasma source

International Nuclear Information System (INIS)

Higashiguchi, T; Otsuka, T; Jiang, W; Endo, A; Li, B; Dunne, P; O'Sullivan, G

2013-01-01

Unresolved transition array (UTA) is scalable to shorter wavelengths, and we demonstrate a table-top broadband emission 'water window' soft x-ray source based on laser-produced plasmas. Resonance emission from multiply charged ions merges to produce intense UTAs in the 2 to 4 nm region, extending below the carbon K edge (4.37 nm). An outline of a microscope design for single-shot live cell imaging is proposed based on a bismuth (Bi) plasma UTA source, coupled to multilayer mirror optics

New x-ray optical system for fluorescence beamline at Hasylab

International Nuclear Information System (INIS)

Falkenberg, G.; Tschentscher, T.

2000-01-01

Beamline L at HASYLAB/DESY is actually dedicated to micro x-ray fluorescence (μ-XRF) experiments using the white beam from a bending magnet of the storage ring DORIS III. To extend the applicability of beamline L to other x-ray fluorescence techniques, such as synchrotron radiation total reflection x-ray fluorescence (SR-TXRF) and micro x-ray absorption near edge structures in fluorescence mode (μ-XANES), new x-ray optics have been designed and are under installation at the moment. The suitability of beamline L for SR-TXRF experiments has been shown previously in a number of studies using temporary setups for beam monochromatization and collimation. The new optical system comprises a slit system, a pair of x-ray mirrors for focussing, collimation and high energy cut-off (12 keV and 30 keV), a double multilayer monochromator for broad bandpass applications (TXRF) and a double perfect-crystal monochromator for spectroscopy (XANES, speciation). The multilayer monochromator will utilize a pair of NiC with a spacing of 4.0 nm for the energy range 2-10 keV and a second pair of WB 4 C with a spacing of 3.0 nm for the range 4-30 keV. To extend the energy range for broad bandpass applications to higher photon energies SiGe gradient crystals are foreseen (ΔE/E ∼ 10 -3 ). For the perfect-crystal monochromator we have chosen a pair of Ge 111 crystals for the energy range 2-10 keV and Si 111 crystals for 7-90 keV. To enable the use of low photon energies down to 2 keV the monochromator vessel is sealed to the ring vacuum by a 25 μm thick carbon window. The mirrors and monochromators deflect the beam vertically and can be moved out of the beam independently. Fixed exit geometry permits the illumination of the same sample spot with different wavelength and energy bands. All optical elements accept the full vertical beam opening in order to enable both vertical and horizontal geometries for sample and detector. (author)

Reflection of femtosecond pulses from soft X-ray free-electron laser by periodical multilayers

Energy Technology Data Exchange (ETDEWEB)

Ksenzov, D.; Grigorian, S.; Pietsch, U. [Faculty of Physics, University of Siegen (Germany); Hendel, S.; Bienert, F.; Sacher, M.D.; Heinzmann, U. [Faculty of Physics, University of Bielefeld (Germany)

2009-08-15

Recent experiments on a soft X-ray free-electron laser (FEL) source (FLASH in Hamburg) have shown that multilayers (MLs) can be used as optical elements for highly intense X-ray irradiation. An effort to find most appropriate MLs has to consider the femtosecond time structure and the particular photon energy of the FEL. In this paper we have analysed the time response of 'low absorbing' MLs (e.g. such as La/B{sub 4}C) as a function of the number of periods. Interaction of a pulse train of Gaussian shaped sub-pulses using a realistic ML grown by electron-beam evaporation technique has been analysed in the soft-X-ray range. The structural parameters of the MLs were obtained by reflectivity measurements at BESSY II and subsequent profile fittings. (Abstract Copyright [2009], Wiley Periodicals, Inc.)

The reflected amplitude ratio of multilayers and superlattice describe the dynamical diffraction of x-rays

International Nuclear Information System (INIS)

Bhatti, Q.A.; Mangi, F.A.

2006-01-01

Calculating the rocking curves of complicated layered structures, such as non-ideal super lattices on perfect crystals are clearly exposed with observed diffraction profile. Recursion formulas for calculating reflected amplitude ratio of multilayer and super lattices have been involved from the Takagi-Taupin differential equation, which describes the dynamical diffraction of X-rays in deformed crystal. The Kinematical theory can computing time only in case of ideal superlattice for which geometric series can be used but the reflectivity must be below 10 % so that multiple reflections can be neglected for a perfect crystal of arbitrary thickness the absorption at the centre of the dynamical reflection is found to be proportional to the square root of the reflectivity. Sputter- deposited periodic multilayers of tungsten and carbon can be considered as an artificial crystal, for which dynamical X-rays diffraction calculations give the result very similar to those of macroscopic optical description in terms of the complex index of refraction and Frensnel relation coefficient. (author)

Focusing of hard x-rays to 16 nanometers with a multilayer Laue lens

International Nuclear Information System (INIS)

Kang, Hyon Chol; Yan Hanfei; Winarski, Robert P.; Holt, Martin V.; Maser, Joerg; Liu Chian; Conley, Ray; Vogt, Stefan; Macrander, Albert T.; Stephenson, G. Brian

2008-01-01

We report improved results for hard x-ray focusing using a multilayer Laue lens (MLL). We have measured a line focus of 16 nm width with an efficiency of 31% at a wavelength λ=0.064 nm (19.5 keV) using a partial MLL structure with an outermost zone width of 5 nm. The results are in good agreement with the theoretically predicted performance

Efficient focusing of 8 keV X-rays with multilayer Fresnel zone plates fabricated by atomic layer deposition and focused ion beam milling

International Nuclear Information System (INIS)

Mayer, Marcel; Keskinbora, Kahraman; Grévent, Corinne; Szeghalmi, Adriana; Knez, Mato; Weigand, Markus; Snigirev, Anatoly; Snigireva, Irina; Schütz, Gisela

2013-01-01

The fabrication and performance of multilayer Al 2 O 3 /Ta 2 O 5 Fresnel zone plates in the hard X-ray range and a discussion of possible future developments considering available materials are reported. Fresnel zone plates (FZPs) recently showed significant improvement by focusing soft X-rays down to ∼10 nm. In contrast to soft X-rays, generally a very high aspect ratio FZP is needed for efficient focusing of hard X-rays. Therefore, FZPs had limited success in the hard X-ray range owing to difficulties of manufacturing high-aspect-ratio zone plates using conventional techniques. Here, employing a method of fabrication based on atomic layer deposition (ALD) and focused ion beam (FIB) milling, FZPs with very high aspect ratios were prepared. Such multilayer FZPs with outermost zone widths of 10 and 35 nm and aspect ratios of up to 243 were tested for their focusing properties at 8 keV and shown to focus hard X-rays efficiently. This success was enabled by the outstanding layer quality thanks to ALD. Via the use of FIB for slicing the multilayer structures, desired aspect ratios could be obtained by precisely controlling the thickness. Experimental diffraction efficiencies of multilayer FZPs fabricated via this combination reached up to 15.58% at 8 keV. In addition, scanning transmission X-ray microscopy experiments at 1.5 keV were carried out using one of the multilayer FZPs and resolved a 60 nm feature size. Finally, the prospective of different material combinations with various outermost zone widths at 8 and 17 keV is discussed in the light of the coupled wave theory and the thin-grating approximation. Al 2 O 3 /Ir is outlined as a promising future material candidate for extremely high resolution with a theoretical efficiency of more than 20% for as small an outermost zone width as 10 nm at 17 keV

Small d-spacing WC/SiC multilayers for future hard X-ray telescope designs

DEFF Research Database (Denmark)

Jensen, C.P.; Madsen, K.K.; Christensen, Finn Erland

2005-01-01

Multilayer coatings for reflecting hard X-rays up to 80keV, like W/Si and Pt/C, have been studied for several years. To go to higher energies, in the range of 100 keV to 250 keV, one needs coatings with smaller d-spacings than can currently be made with these material combinations, and a lower...

Interaction of femtosecond X-ray pulses with periodical multilayer structures

International Nuclear Information System (INIS)

Ksenzov, Dmitry

2010-01-01

The VUV Free Electron Laser FLASH operates in soft X-ray range and produces high-intensive pulse trains with few tens femtoseconds duration. The transversely fully coherent beam will open new experiments in solid state physics which can not be studied with present radiation sources. The study of the time dependent response of the multilayer to the X-ray pulse can provide insights into the process of interaction of highly intense FEL radiation with matter. To test the influence of electron excitation on the optical properties of boron carbide, the refractive index of B 4 C was measured near B K-edge by energy-resolved photon-in-photon-out method probing a Bragg reflection from periodical multilayers. The measured data clearly show that the variation of the fine structure of the Kabsorption edges due to the chemical nature of the absorber element. The knowledge obtained from experiments with continuous radiation was used to design the respective experiments with pulse from the FEL. In my thesis, it is proposed that the geometrical setup, where the incident pulse arrives from the FEL under the angle close to the 1st order ML Bragg peak, provides the most valuable information. Preliminary simulation considering form factors of neutral and ionized boron showed that due to ionization, pronounced changes in the reflectivity curve are expected. The proposed scheme can be the powerful tool to study the various processes within the electronic subsystem of the FEL pulse interaction with matter. This type of investigations gives a deep understanding of the nature of the electronic excitation and the recombination at the femtosecond scale. (orig.)

Interaction of femtosecond X-ray pulses with periodical multilayer structures

Energy Technology Data Exchange (ETDEWEB)

Ksenzov, Dmitry

2010-07-01

The VUV Free Electron Laser FLASH operates in soft X-ray range and produces high-intensive pulse trains with few tens femtoseconds duration. The transversely fully coherent beam will open new experiments in solid state physics which can not be studied with present radiation sources. The study of the time dependent response of the multilayer to the X-ray pulse can provide insights into the process of interaction of highly intense FEL radiation with matter. To test the influence of electron excitation on the optical properties of boron carbide, the refractive index of B{sub 4}C was measured near B K-edge by energy-resolved photon-in-photon-out method probing a Bragg reflection from periodical multilayers. The measured data clearly show that the variation of the fine structure of the Kabsorption edges due to the chemical nature of the absorber element. The knowledge obtained from experiments with continuous radiation was used to design the respective experiments with pulse from the FEL. In my thesis, it is proposed that the geometrical setup, where the incident pulse arrives from the FEL under the angle close to the 1st order ML Bragg peak, provides the most valuable information. Preliminary simulation considering form factors of neutral and ionized boron showed that due to ionization, pronounced changes in the reflectivity curve are expected. The proposed scheme can be the powerful tool to study the various processes within the electronic subsystem of the FEL pulse interaction with matter. This type of investigations gives a deep understanding of the nature of the electronic excitation and the recombination at the femtosecond scale. (orig.)

Comparison of Mg-based multilayers for solar He II radiation at 30.4 nm wavelength

Energy Technology Data Exchange (ETDEWEB)

Zhu Jingtao; Zhou Sika; Li Haochuan; Huang Qiushi; Wang Zhanshan; Le Guen, Karine; Hu, Min-Hui; Andre, Jean-Michel; Jonnard, Philippe

2010-07-10

Mg-based multilayers, including SiC/Mg, Co/Mg, B4C/Mg, and Si/Mg, are investigated for solar imaging and a He II calibration lamp at a 30.4 nm wavelength. These multilayers were fabricated by a magnetron sputtering method and characterized by x-ray reflection. The reflectivities of these multilayers were measured by synchrotron radiation. Near-normal-incidence reflectivities of Co/Mg and SiC/Mg multilayer mirrors are as high as 40.3% and 44.6%, respectively, while those of B4C/Mg and Si/Mg mirrors are too low for application. The measured results suggest that SiC/Mg, Co/Mg multilayers are promising for a 30.4 nm wavelength.

Center for X-Ray Optics, 1992

International Nuclear Information System (INIS)

1993-08-01

This report discusses the following topics: Center for X-Ray Optics; Soft X-Ray Imaging wit Zone Plate Lenses; Biological X-Ray microscopy; Extreme Ultraviolet Lithography for Nanoelectronic Pattern Transfer; Multilayer Reflective Optics; EUV/Soft X-ray Reflectometer; Photoemission Microscopy with Reflective Optics; Spectroscopy with Soft X-Rays; Hard X-Ray Microprobe; Coronary Angiography; and Atomic Scattering Factors

Simultaneous acquisition of X-ray spectra using a multi-wire, position-sensitive gas flow detector

International Nuclear Information System (INIS)

Beaven, Peter A.; Marmotti, Mauro; Kampmann, Reinhard; Knoth, Joachim; Schwenke, Heinrich

2003-01-01

A multi-wire, gas-filled position-sensitive detector has been developed for the simultaneous recording of wavelength-dispersed X-ray signals that enables X-ray fluorescence spectrometry with a limited multi-element capability in the low Z element range. Details of the modular construction of the detector are given. The detector performance was characterized using Al-Kα radiation and a variable slit system. The detector has been applied in a laboratory spectrometer equipped with an electron source and a double multilayer mirror device as the wavelength-dispersing element. Spectra from Al and Si obtained in the simultaneous acquisition mode show good agreement with calculations performed using a ray-tracing model

Camera for coherent diffractive imaging and holography with a soft-x-ray free-electron laser

International Nuclear Information System (INIS)

Bajt, Sasa; Chapman, Henry N.; Spiller, Eberhard A.; Alameda, Jennifer B.; Woods, Bruce W.; Frank, Matthias; Bogan, Michael J.; Barty, Anton; Boutet, Sebastien; Marchesini, Stefano; Hau-Riege, Stefan P.; Hajdu, Janos; Shapiro, David

2008-01-01

We describe a camera to record coherent scattering patterns with a soft-x-ray free-electron laser (FEL). The camera consists of a laterally graded multilayer mirror, which reflects the diffraction pattern onto a CCD detector. The mirror acts as a bandpass filter for both the wavelength and the angle, which isolates the desired scattering pattern from nonsample scattering or incoherent emission from the sample. The mirror also solves the particular problem of the extreme intensity of the FEL pulses, which are focused to greater than 10 14 W/cm 2 . The strong undiffracted pulse passes through a hole in the mirror and propagates onto a beam dump at a distance behind the instrument rather than interacting with a beam stop placed near the CCD. The camera concept is extendable for the full range of the fundamental wavelength of the free electron laser in Hamburg (FLASH) FEL (i.e., between 6 and 60 nm) and into the water window. We have fabricated and tested various multilayer mirrors for wavelengths of 32, 16, 13.5, and 4.5 nm. At the shorter wavelengths mirror roughness must be minimized to reduce scattering from the mirror. We have recorded over 30,000 diffraction patterns at the FLASH FEL with no observable mirror damage or degradation of performance

Design, conception, and metrology of Extreme Ultraviolet multilayers mirrors resistant environments of space and EUV sources

International Nuclear Information System (INIS)

Hecquet, Ch.

2009-03-01

The Extreme Ultraviolet Spectrum (EUV) wavelengths, which range between 13 nm and 40 nm, have many applications in science and technology. These have been developed for example in plasma physics (high order harmonics sources, X ray lasers). The work presented is about the design, the fabrication and the metrology of periodic multilayer mirrors. The main motivation of this study is to establish a cycle of development taking into account both the optical properties of reflective coatings (reflectivity, spectral selectivity, attenuation) and their behaviour under various environments. To improve the spectral selectivity, new multilayer periodic structures have been developed. They are characterized by a bimodal reflectance profile with adjustable attenuation. The effect of environment on the stability of performance is especially critical for the optical collection. The addition of material barriers has stabilized the performance of the peak reflectivity for over 200 h at 400 C deg. and it reduces the influence of other factors of instability on the reflectance. In addition, all structures have been fabricated successfully and evaluated in severe environments. (author)

Ion beam sputtered aluminum based multilayer mirrors for extreme ultraviolet solar imaging

Energy Technology Data Exchange (ETDEWEB)

Ziani, A. [Laboratoire Charles Fabry, Institut d' Optique, CNRS, Univ Paris Sud, 2 Avenue Augustin Fresnel, 91127 Palaiseau cedex France (France); Centre National d’Etudes Spatiales (CNES), 18 Avenue E. Belin, 31401 Toulouse (France); Delmotte, F., E-mail: Franck.Delmotte@InstitutOptique.fr [Laboratoire Charles Fabry, Institut d' Optique, CNRS, Univ Paris Sud, 2 Avenue Augustin Fresnel, 91127 Palaiseau cedex France (France); Le Paven-Thivet, C. [Institut d' Electronique et de Télécommunications de Rennes (IETR) UMR-CNRS 6164, Université de Rennes 1, UEB, IUT Saint Brieuc, 18 rue Henri Wallon, 22004 Saint Brieuc cedex France (France); Meltchakov, E.; Jérome, A. [Laboratoire Charles Fabry, Institut d' Optique, CNRS, Univ Paris Sud, 2 Avenue Augustin Fresnel, 91127 Palaiseau cedex France (France); Roulliay, M. [Institut des Sciences Moléculaires d’Orsay UMR 8214, Univ Paris Sud, 91405 Orsay France (France); Bridou, F. [Laboratoire Charles Fabry, Institut d' Optique, CNRS, Univ Paris Sud, 2 Avenue Augustin Fresnel, 91127 Palaiseau cedex France (France); Gasc, K. [Centre National d’Etudes Spatiales (CNES), 18 Avenue E. Belin, 31401 Toulouse (France)

2014-02-03

In this paper, we report on the design, synthesis and characterization of extreme ultraviolet interferential mirrors for solar imaging applications in the spectral range 17 nm–34 nm. This research is carried out in the context of the preparation of the European Space Agency Solar Orbiter mission. The purpose of this study consists in optimizing the deposition of Al-based multilayers by ion beam sputtering according to several parameters such as the ion beam current and the sputtering angle. After optimization of Al thin films, several kinds of Al-based multilayer mirrors have been compared. We have deposited and characterized bi-material and also tri-material periodic multilayers: aluminum/molybdenum [Al/Mo], aluminum/molybdenum/boron carbide [Al/Mo/B{sub 4}C] and aluminum/molybdenum/silicon carbide [Al/Mo/SiC]. Best experimental results have been obtained on Al/Mo/SiC samples: we have measured reflectivity up to 48% at 17.3 nm and 27.5% at 28.2 nm on a synchrotron radiation source. - Highlights: • Design and synthesis of extreme ultraviolet interferential mirrors. • Optimization of aluminum thin films by adjusting several deposition parameters. • Comparison of results obtained with different types of Al-based multilayer mirrors. • Reflectivity up to 48% at 17.3 nm on a synchrotron radiation source.

Ion beam sputtered aluminum based multilayer mirrors for extreme ultraviolet solar imaging

International Nuclear Information System (INIS)

Ziani, A.; Delmotte, F.; Le Paven-Thivet, C.; Meltchakov, E.; Jérome, A.; Roulliay, M.; Bridou, F.; Gasc, K.

2014-01-01

In this paper, we report on the design, synthesis and characterization of extreme ultraviolet interferential mirrors for solar imaging applications in the spectral range 17 nm–34 nm. This research is carried out in the context of the preparation of the European Space Agency Solar Orbiter mission. The purpose of this study consists in optimizing the deposition of Al-based multilayers by ion beam sputtering according to several parameters such as the ion beam current and the sputtering angle. After optimization of Al thin films, several kinds of Al-based multilayer mirrors have been compared. We have deposited and characterized bi-material and also tri-material periodic multilayers: aluminum/molybdenum [Al/Mo], aluminum/molybdenum/boron carbide [Al/Mo/B 4 C] and aluminum/molybdenum/silicon carbide [Al/Mo/SiC]. Best experimental results have been obtained on Al/Mo/SiC samples: we have measured reflectivity up to 48% at 17.3 nm and 27.5% at 28.2 nm on a synchrotron radiation source. - Highlights: • Design and synthesis of extreme ultraviolet interferential mirrors. • Optimization of aluminum thin films by adjusting several deposition parameters. • Comparison of results obtained with different types of Al-based multilayer mirrors. • Reflectivity up to 48% at 17.3 nm on a synchrotron radiation source

Optical technologies for extreme-ultraviolet and soft X-ray coherent sources

International Nuclear Information System (INIS)

Canova, Federico; Poletto, Luca

2015-01-01

The book reviews the most recent achievements in optical technologies for XUV and X-ray coherent sources. Particular attention is given to free-electron-laser facilities, but also to other sources available at present, such as synchrotrons, high-order laser harmonics and X-ray lasers. The optical technologies relevant to each type of source are discussed. In addition, the main technologies used for photon handling and conditioning, namely multilayer mirrors, adaptive optics, crystals and gratings are explained. Experiments using coherent light received during the last decades a lot of attention for the X-ray regime. Strong efforts were taken for the realization of almost fully coherent sources, e.g. the free-electron lasers, both as independent sources in the femtosecond and attosecond regimes and as seeding sources for free-electron-lasers and X-ray gas lasers. In parallel to the development of sources, optical technologies for photon handling and conditioning of such coherent and intense X-ray beams advanced. New problems were faced for the realization of optical components of beamlines demanding to manage coherent X-ray photons, e.g. the preservation of coherence and time structure of ultra short pulses.

New technology and techniques for x-ray mirror calibration at PANTER

Science.gov (United States)

Freyberg, Michael J.; Budau, Bernd; Burkert, Wolfgang; Friedrich, Peter; Hartner, Gisela; Misaki, Kazutami; Mühlegger, Martin

2008-07-01

The PANTER X-ray Test Facility has been utilized successfully for developing and calibrating X-ray astronomical instrumentation for observatories such as ROSAT, Chandra, XMM-Newton, Swift, etc. Future missions like eROSITA, SIMBOL-X, or XEUS require improved spatial resolution and broader energy band pass, both for optics and for cameras. Calibration campaigns at PANTER have made use of flight spare instrumentation for space applications; here we report on a new dedicated CCD camera for on-ground calibration, called TRoPIC. As the CCD is similar to ones used for eROSITA (pn-type, back-illuminated, 75 μm pixel size, frame store mode, 450 μm micron wafer thickness, etc.) it can serve as prototype for eROSITA camera development. New techniques enable and enhance the analysis of measurements of eROSITA shells or silicon pore optics. Specifically, we show how sub-pixel resolution can be utilized to improve spatial resolution and subsequently the characterization of of mirror shell quality and of point spread function parameters in particular, also relevant for position reconstruction of astronomical sources in orbit.

X-ray fluorescence analysis and optical emission spectrometry of an roman mirror from Tomis, Romania

International Nuclear Information System (INIS)

Belc, M.; Bogoi, M.; Ionescu, D.; Guita, D.; Caiteanu, S.; Caiteanu, D.

2000-01-01

The miscellaneous population of Roman Empire, their diverse cultural tradition, their ability to assimilate the roman civilization spirits, had determined a permanent reassessment superimposed upon the roman contribution. Analysis was undertaken using optical emission spectrometry and non-destructive X-ray fluorescence. X-ray fluorescence analysis is a well-established method and is often used in archaeometry and other work dealing with valuable objects pertaining to the history of art and civilization. Roman mirror analysed has been found not to be made of speculum (a high tin bronze). (authors)

A tunable x-ray microprobe using synchrotron radiation

International Nuclear Information System (INIS)

Wu, Y.; Thompson, A.C.; Underwood, J.H.; Giauque, R.D.; Chapman, K.; Rivers, M.L.; Jones, K.W.

1989-08-01

We describe an x-ray microprobe using multilayer mirrors. Previously, we had demonstrated a Kirkpatrick-Baez type focusing system working at both 8 and 10 keV and successfully applied it to a variety of applications, including the determination of elemental contents in fluid inclusions. In this paper, we show that the usable excitation energy for this microprobe is not restricted to between 8 and 10 keV, and furthermore, it can be simply tuned in operation. A 10-keV x-ray fluorescence microprobe can be used to measure the concentration of the elements form potassium (Z = 19) to zinc (Z = 30) using K x-ray lines, and from cadmium (Z = 48) to erbium (Z = 68) using L x-ray lines. There are a number of geologically important elements in the gap between gallium (Z = 31) and silver(Z = 47) and also with Z > 68. In order to cover this range, a higher excitation energy is required. On the other hand, for samples that contain major elements with absorption edges lower than the excitation energy, it would be hard to detect other mirror elements because of the strong signal from the major elements and the background they produce. In this case, a tunable x-ray source can be used to avoid the excitation of the major elements. We demonstrate that, with the existing setup, it is possible to tune the excitation energy from 6 keV to 14 keV, in this range, the intensity does not decrease by more than one order of magnitude. As an illustration, a geological sample was examined by using two different excitation energy range as well as the possibility of improving the intensity. 11 refs., 5 figs

Fabrication of 200 nanometer period centimeter area hard x-ray absorption gratings by multilayer deposition

Science.gov (United States)

Lynch, S K; Liu, C; Morgan, N Y; Xiao, X; Gomella, A A; Mazilu, D; Bennett, E E; Assoufid, L; de Carlo, F; Wen, H

2012-01-01

We describe the design and fabrication trials of x-ray absorption gratings of 200 nm period and up to 100:1 depth-to-period ratios for full-field hard x-ray imaging applications. Hard x-ray phase-contrast imaging relies on gratings of ultra-small periods and sufficient depth to achieve high sensitivity. Current grating designs utilize lithographic processes to produce periodic vertical structures, where grating periods below 2.0 μm are difficult due to the extreme aspect ratios of the structures. In our design, multiple bilayers of x-ray transparent and opaque materials are deposited on a staircase substrate, and mostly on the floor surfaces of the steps only. When illuminated by an x-ray beam horizontally, the multilayer stack on each step functions as a micro-grating whose grating period is the thickness of a bilayer. The array of micro-gratings over the length of the staircase works as a single grating over a large area when continuity conditions are met. Since the layers can be nanometers thick and many microns wide, this design allows sub-micron grating periods and sufficient grating depth to modulate hard x-rays. We present the details of the fabrication process and diffraction profiles and contact radiography images showing successful intensity modulation of a 25 keV x-ray beam. PMID:23066175

Performance of multilayer coated silicon pore optics

Science.gov (United States)

Ackermann, M. D.; Collon, M. J.; Jensen, C. P.; Christensen, F. E.; Krumrey, M.; Cibik, L.; Marggraf, S.; Bavdaz, M.; Lumb, D.; Shortt, B.

2010-07-01

The requirements for the IXO (International X-ray Observatory) telescope are very challenging in respect of angular resolution and effective area. Within a clear aperture with 1.7 m > R > 0.25 m that is dictated by the spacecraft envelope, the optics technology must be developed to satisfy simultaneously requirements for effective area of 2.5 m2 at 1.25 keV, 0.65 m2 at 6 keV and 150 cm2 at 30 keV. The reflectivity of the bare mirror substrate materials does not allow these requirements to be met. As such the IXO baseline design contains a coating layout that varies as a function of mirror radius and in accordance with the variation in grazing incidence angle. The higher energy photon response is enhanced through the use of depth-graded multilayer coatings on the inner radii mirror modules. In this paper we report on the first reflectivity measurements of wedged ribbed silicon pore optics mirror plates coated with a depth graded W/Si multilayer. The measurements demonstrate that the deposition and performance of the multilayer coatings is compatible with the SPO production process.

An X-ray and optical study of the ultracompact X-ray binary A 1246-58

NARCIS (Netherlands)

in 't Zand, J.J.M.; Bassa, C.G.; Jonker, P.G.; Keek, L.; Verbunt, F.W.M.; Méndez, M.; Markwardt, C.B.

2008-01-01

Results are discussed of an X-ray and optical observation campaign of the low-mass X-ray binary A 1246-58 performed with instruments on Satellite per Astronomia X ("BeppoSAX"), the Rossi X-ray Timing Explorer (RXTE), the X-ray Multi-mirror Mission ("XMM-Newton"), the Swift mission, and the Very

Development of grazing incidence multilayer mirrors for hard X-ray focusing telescopes

DEFF Research Database (Denmark)

Mao, Peter H.; Harrison, Fiona A.; Platonov, Yuriy Y.

1997-01-01

on the inside surface of a quarter cylinder section. We found that interfacial roughness (σ) in the multilayers was typically between 3.5 and 4.0 Å on DESAG glass, and between 4.5 and 5.0 Å on the ERAFs. Also, we found that coatings deposited on glass that has been thermally formed into a cylindrical shape...

Performance limitations of imaging microscopes for soft x-ray applications

International Nuclear Information System (INIS)

Lewotsky, K.L.; Kotha, A.; Harvey, J.E.

1993-01-01

Recent advances in the fabrication of nanometer-scale multilayer structures have yielded high-reflectance mirrors operating at near-normal incidence for soft X-ray wavelengths. These developments have stimulated renewed interest in high-resolution soft X-ray microscopy. The design of a Schwarzschild imaging microscope for soft X-ray applications has been reported by Hoover and Shealy. Based upon a geometrical ray-trace analysis of the residual design errors, diffraction-limited performance at a wavelength of 100 angstrom was predicted over an object size (diameter) of 0.4 mm. In this paper the authors expand upon the previous analysis of the Schwarzschild X-ray microscope design by determining the total image degradation due to diffraction, geometrical aberrations, alignment errors, and realistic assumptions concerning optical fabrication errors. NASA's Optical Surface Analysis Code (OSAC) is used to model the image degradation effects of residual surface irregularities over the entire range of relevant spatial frequencies. This includes small angle scattering effects due to mid spatial frequency surface errors falling between the traditional figure and finish specifications. Performance predictions are presented parametrically to provide some insight into the optical fabrication and alignment tolerances necessary to meet a particular image quality requirement

Multi-layer x-ray screens

International Nuclear Information System (INIS)

Rabatin, J.G.

1984-01-01

Rare earth oxyhalide phosphors activated with thulium ion are employed in X-ray intensifying screens having modified ultraviolet emission characteristics which reduce crossover effects without significant reduction in film speed and further increases screen brightness. Relatively low concentration levels of the thulium activator ion have been found to shift the ultraviolet emission of said phosphor when excited by X-rays to lower wavelengths in both the ultraviolet and near-ultraviolet spectral regions

Measurement of multilayer mirror reflectivity and stimulated emission in the XUV spectral region

International Nuclear Information System (INIS)

Keane, C.; Nam, C.H.; Meixler, L.; Milchberg, H.; Skinner, C.H.; Suckewer, S.; Voorhees, D.; Barbee, T.

1986-03-01

We present measurements of multilayer mirror reflectivity and stimulated emission in the XUV spectral region. A molybdenum-silicon multilayer mirror with 12% measured reflectivity at 182 A was found to produce a 120% enhancement of the C VI 182 A line (3 → 2 transition) in a strongly recombining plasma. No such enhancement of the CV 186.7 A line was seen, demonstrating amplification of stimulated emission at 182 A

Optimization of a multilayer Laue lens system for a hard x-ray nanoprobe

International Nuclear Information System (INIS)

Jiang, Hui; Wang, Hua; Mao, Chengwen; Li, Aiguo; He, Yan; Dong, Zhaohui; Zheng, Yi

2014-01-01

Detailed designs of a multilayer Laue lens system for a hard x-ray nanoprobe, including flat and wedged types, are presented, to realize nanoscale point focus and high diffraction efficiency simultaneously. The difficulty of movement and alignment for lens, aperture and sample are considered in the optimization process. Considering the practical requirements of future experiments, the features of the beamline and the structural imperfections, the working energy range, the beam vibration and structural errors are estimated and discussed. (paper)

Total reflection X-ray fluorescence analysis with synchrotron radiation monochromatized by multilayer structures

International Nuclear Information System (INIS)

Rieder, R.; Wobrauschek, P.; Ladisich, W.; Streli, C.; Aiginger, H.; Garbe, S.; Gaul, G.; Knoechel, A.; Lechtenberg, F.

1995-01-01

To achieve lowest detection limits in total reflection X-ray fluorescence analysis (TXRF) synchrotron radiation has been monochromatized by a multilayer structure to obtain a relative broad energy band compared to Bragg single crystals for an efficient excitation. The energy has been set to 14 keV, 17.5 keV, 31 keV and about 55 keV. Detection limits of 20 fg and 150 fg have been achieved for Sr and Cd, respectively. ((orig.))

High efficiency multilayer blazed gratings for EUV and soft X-rays: Recent developments

International Nuclear Information System (INIS)

Voronov, Dmitriy; Ahn, Minseung; Anderson, Erik; Cambie, Rossana; Chang, Chih-Hao; Goray, Leonid; Gullikson, Eric; Heilmann, Ralf; Salmassi, Farhad; Schattenburg, Mark; Warwick, Tony; Yashchuk, Valeriy; Padmore, Howard

2011-01-01

Multilayer coated blazed gratings with high groove density are the best candidates for use in high resolution EUV and soft x-ray spectroscopy. Theoretical analysis shows that such a grating can be potentially optimized for high dispersion and spectral resolution in a desired high diffraction order without significant loss of diffraction efficiency. In order to realize this potential, the grating fabrication process should provide a perfect triangular groove profile and an extremely smooth surface of the blazed facets. Here we report on recent progress achieved at the Advanced Light Source (ALS) in fabrication of high quality multilayer coated blazed gratings. The blazed gratings were fabricated using scanning beam interference lithography followed by wet anisotropic etching of silicon. A 200 nm period grating coated with a Mo/Si multilayer composed with 30 bi-layers demonstrated an absolute efficiency of 37.6percent in the 3rd diffraction order at 13.6 nm wavelength. The groove profile of the grating was thoroughly characterized with atomic force microscopy before and after the multilayer deposition. The obtained metrology data were used for simulation of the grating efficiency with the vector electromagnetic PCGrate-6.1 code. The simulations showed that smoothing of the grating profile during the multilayer deposition is the main reason for efficiency losses compared to the theoretical maximum. Investigation of the grating with cross-sectional transmission electron microscopy revealed a complex evolution of the groove profile in the course of the multilayer deposition. Impact of the shadowing and smoothing processes on growth of the multilayer on the surface of the sawtooth substrate is discussed.

Investigation of multilayer X-ray optics for 6 keV to 20 keV energy range

Czech Academy of Sciences Publication Activity Database

Oberta, Peter; Platonov, Y.; Flechsig, U.

2012-01-01

Roč. 19, č. 5 (2012), s. 675-681 ISSN 0909-0495 Institutional research plan: CEZ:AV0Z10100522 Keywords : X-ray optics * multilayer * energy resolution Subject RIV: BH - Optics, Masers, Lasers Impact factor: 2.186, year: 2012 http://journals.iucr.org/s/issues/2012/05/00/issconts.html

Residual stress analysis of a multi-layer thin film structure by destructive (curvature) and non-destructive (x-ray) methods

International Nuclear Information System (INIS)

Chen, P.C.; Oshida, Y.

1989-01-01

Multi-layer thin film which has structure of Cu/Cr/K/Cr/Cu prepared by sputtering process was analyzed for interfacial stresses for as-deposited conditions. This structure was also annealed at 150 degrees C, and 350 degrees C for around 15 min. in a vacuum and cooled slowly down for stress analyses. Equations for residual stress estimations for homogeneous material system using layer removal technique (stress relief) is now applied for inhomogeneous system (multi-layer structure). The results are compared with the data obtained from x-ray diffraction technique by using sin 2 Ψ - 2 θ method, for Cu layer. From the present analyses, the data obtained using layer removal seem to be qualitatively consistent with but not quantitatively in agreement with x-ray method

Low energy x-ray spectrometer

International Nuclear Information System (INIS)

Woodruff, W.R.

1981-01-01

A subkilovolt spectrometer has been produced to permit high-energy-resolution, time-dependent x-ray intensity measurements. The diffracting element is a curved mica (d = 9.95A) crystal. To preclude higher order (n > 1) diffractions, a carbon x-ray mirror that reflects only photons with energies less than approx. 1.1 keV is utilized ahead of the diffracting element. The nominal energy range of interest is 800 to 900 eV. The diffracted photons are detected by a gold-surface photoelectric diode designed to have a very good frequency response, and whose current is recorded on an oscilloscope. A thin, aluminium light barrier is placed between the diffracting crystal and the photoelectric diode detector to keep any uv generated on or scattered by the crystal from illuminating the detector. High spectral energy resolution is provided by many photocathodes between 8- and 50-eV wide placed serially along the diffracted x-ray beam at the detector position. The spectrometer was calibrated for energy and energy dispersion using the Ni Lα 1 2 lines produced in the LLNL IONAC accelerator and in third order using a molybdenum target x-ray tube. For the latter calibration the carbon mirror was replaced by one surfaced with rhodium to raise the cut-off energy to about 3 keV. The carbon mirror reflection dependence on energy was measured using one of our Henke x-ray sources. The curved mica crystal diffraction efficiency was measured on our Low-Energy x-ray (LEX) machine. The spectrometer performs well although some changes in the way the x-ray mirror is held are desirable. 16 figures

Investigation of the X-ray diffraction properties of a synthetic multilayer. 1998 summer research program for high school juniors at the University of Rochester's Laboratory for Laser Energetics. Student research reports

International Nuclear Information System (INIS)

Ostromogolsky, P.

1999-03-01

In this investigation spectroscopy was used to evaluate the x-ray diffraction properties of a synthetic WB 4 C multilayer for possible use in the OMEGA gated monochromatic x-ray imager (GMXI). The multilayer was placed on a diffractometer, and measurements were made with a lithium-drifted silicon [Si(Li)] x-ray detector, connected to a multi-channel analyzer. The properties of the multilayer were inferred from gaussian fits to the measured diffraction curves. A multilayer with a 2d spacing of 25 angstrom was tested at energies from 1.7 to 4.5 keV

Trace Element Mapping of a Biological Specimen by a Full-Field X-ray Fluorescence Imaging Microscope with a Wolter Mirror

International Nuclear Information System (INIS)

Hoshino, Masato; Yamada, Norimitsu; Ishino, Toyoaki; Namiki, Takashi; Watanabe, Norio; Aoki, Sadao

2007-01-01

A full-field X-ray fluorescence imaging microscope with a Wolter mirror was applied to the element mapping of alfalfa seeds. The X-ray fluorescence microscope was built at the Photon Factory BL3C2 (KEK). X-ray fluorescence images of several growing stages of the alfalfa seeds were obtained. X-ray fluorescence energy spectra were measured with either a solid state detector or a CCD photon counting method. The element distributions of iron and zinc which were included in the seeds were obtained using a photon counting method

High-Resolution and Lightweight X-ray Optics for the X-Ray Surveyor

Science.gov (United States)

Zhang, William

Envisioned in "Enduring Quest, Daring Visions" and under study by NASA as a potential major mission for the 2020s, the X-ray Surveyor mission will likely impose three requirements on its optics: (1) high angular resolution: 0.5 PSF, (2) large effective area: e10,000 cm2 or more, and (3) affordable production cost: $500M. We propose a technology that can meet these requirements by 2020. It will help the X-ray Surveyor secure the endorsement of the coming decadal survey and enable its implementation following WFIRST. The technology comprises four elements: (1) fabrication of lightweight single crystal silicon mirrors, (2) coating these mirrors with iridium to maximize effective area without figure degradation, (3) alignment and bonding of these mirrors to form meta-shells that will be integrated to make a mirror assembly, and (4) systems engineering to ensure that the mirror assembly meet all science performance and spaceflight environmental requirements. This approach grows out of our existing approach based on glass slumping. Using glass slumping technology, we have been able to routinely build and test mirror modules of 10half-power diameter (HPD). While comparable in HPD to XMM-Newtons electroformed nickel mirrors, these mirror modules are 10 times lighter. Likewise, while comparable in weight to Suzakus epoxy-replicated aluminum foil mirrors, these modules have 10 times better HPD. These modules represent the current state of the art of lightweight X-ray optics. Although both successful and mature, the glass slumping technology has reached its limit and cannot achieve sub-arc second HPD. Therefore, we are pursuing the new approach based on polishing single crystal silicon. The new approach will enable the building and testing of mirror modules, called meta-shells, capable of 3HPD by 2018 and 1HPD by 2020, and has the potential to reach diffraction limits ( 0.1) in the 2020s.

The optical properties of boron carbide near boron K-edge inside periodical multilayers

Energy Technology Data Exchange (ETDEWEB)

Ksenzov, Dmitriy; Schlemper, Christoph; Pietsch, Ullrich [University of Siegen (Germany)

2010-07-01

Multilayer mirrors made for the use in the wavelength range near K-edge of boron (188 eV) are of great interest for X-ray fluorescence analysis of boron content in doped semiconductors, plasma diagnostics, astronomy and lithography. Moreover, multilayer mirrors composed by a metal and a low Z element like boron are used as optical elements in both the soft x-ray spectral range as well as at higher photon energies on 3rd generation synchrotron beamlines. Using an energy-resolved photon-in-photon-out method we reconstructed the optical data from energy dependence of both integrated peak intensity and FWHM of the 1st order ML Bragg peak measured at the UHV triple axis soft-x-ray reflectometer at BESSY II. The experiments clearly demonstrate that the peak shape of the ML Bragg peak is most sensitive to any kind of electronic excitation and recombination in solid. The soft-ray reflectivity can give detailed information for MLs with thickness up to several tens of nanometers. In addition, measurements close to a resonance edge probe the chemical state of the respective constituent accompanied with a high sensitivity of changes close to the sample surface.

Control of a 45-cm long x-ray deformable mirror with either external or internal metrology

Science.gov (United States)

Poyneer, Lisa A.; Pardini, Tommaso; McCarville, Thomas; Palmer, David; Brooks, Audrey

2014-09-01

Our 45-cm long x-ray deformable mirror has 45 actuators along the tangential axis, along with one strain gauge per actuator and eight temperature sensors. We discuss the detailed calibration of the mirror's figure response to voltage (fourth-order) and the strain gauges' response to figure changes (linear). The mirror's cylinder shape changes with temperature, which can be tracked with the temperature sensors. We present initial results of measuring figure change with the strain gauges, which works very well for large changes (> 10 nm peak-to- valley), but is noisy with a single strain reading for small changes (5 nm peak-to-valley).

Polyphenylsilole multilayers--an insight from X-ray electron spectroscopy and density functional theory.

Science.gov (United States)

Diller, Katharina; Ma, Yong; Luo, Yi; Allegretti, Francesco; Liu, Jianzhao; Tang, Ben Zhong; Lin, Nian; Barth, Johannes V; Klappenberger, Florian

2015-12-14

We present a combined investigation by means of X-ray photoelectron spectroscopy (XPS) and near-edge X-ray absorption fine-structure (NEXAFS) spectroscopy of condensed multilayers of two polyphenylsiloles, namely hexaphenylsilole (HPS) and tetraphenylsilole (TPS). Both compounds exhibit very similar spectroscopic signatures, whose interpretation is aided by density functional theory (DFT) calculations. High-resolution XPS spectra of the Si 2p and C 1s core levels of these multilayers indicate a positively charged silicon ion flanked by two negatively charged adjacent carbon atoms in the silole core of both molecules. This result is corroborated quantitatively by DFT calculations on isolated HPS (TPS) molecules, which show a natural bond orbital partial charge of +1.67 e (+1.58 e) on the silicon and -0.34 e (-0.58 e) on the two neighbouring carbon atoms in the silole ring. These charges are conserved in direct contact with a Cu(111) substrate for films of submonolayer coverage, as evidenced by the Si 2p XPS data. The C K-edge NEXAFS spectra of HPS and TPS multilayers exhibit distinct and differing features. Their main characteristics reappear in the simulated spectra and are assigned to the different inequivalent carbon species in the molecule. The angle-dependent measurements hardly reveal any dichroism, i.e., the molecular π-systems are not uniformly oriented parallel or perpendicular with respect to the surface. Changes in the growth conditions of TPS, i.e., a reduction of the substrate temperature from 240 K to 80 K during deposition, lead to a broadening of both XPS and NEXAFS signatures, as well as an upward shift of the Si 2p and C 1s binding energies, indicative of a less ordered growth mode at low temperature.

Diagnosing high density, fast-evolving plasmas using x-ray lasers

International Nuclear Information System (INIS)

Cauble, R.; Da Silva, L.B.; Barbee, T.W. Jr.

1994-09-01

As x-ray laser (XRL) research has matured, it has become possible to reliably utilize XRLs for applications in the laboratory. Laser coherence, high brightness and short pulse duration all make the XRL a unique tool for the diagnosis of laboratory plasmas. The high brightness of XRLs makes them well-suited for imaging and for interferometry when used in conjunction with multilayer mirrors and beamsplitters. We have utilized a soft x-ray laser in such an imaging system to examine laser-produced plasmas using radiography, moire deflectometry, and interferometry. Radiography experiments yield 100-200 ps snapshots of laser driven foils at a resolution of 1-2 μm. Moire deflectometry with an XRL has been used to probe plasmas at higher density than by optical means. Interferograms, which allow direct measurement of electron density in laser plasmas, have been obtained with this system

Experimental study and analytical model of deformation of magnetostrictive films as applied to mirrors for x-ray space telescopes.

Science.gov (United States)

Wang, Xiaoli; Knapp, Peter; Vaynman, S; Graham, M E; Cao, Jian; Ulmer, M P

2014-09-20

The desire for continuously gaining new knowledge in astronomy has pushed the frontier of engineering methods to deliver lighter, thinner, higher quality mirrors at an affordable cost for use in an x-ray observatory. To address these needs, we have been investigating the application of magnetic smart materials (MSMs) deposited as a thin film on mirror substrates. MSMs have some interesting properties that make the application of MSMs to mirror substrates a promising solution for making the next generation of x-ray telescopes. Due to the ability to hold a shape with an impressed permanent magnetic field, MSMs have the potential to be the method used to make light weight, affordable x-ray telescope mirrors. This paper presents the experimental setup for measuring the deformation of the magnetostrictive bimorph specimens under an applied magnetic field, and the analytical and numerical analysis of the deformation. As a first step in the development of tools to predict deflections, we deposited Terfenol-D on the glass substrates. We then made measurements that were compared with the results from the analytical and numerical analysis. The surface profiles of thin-film specimens were measured under an external magnetic field with white light interferometry (WLI). The analytical model provides good predictions of film deformation behavior under various magnetic field strengths. This work establishes a solid foundation for further research to analyze the full three-dimensional deformation behavior of magnetostrictive thin films.

The use of x-ray interferometry to investigate the linearity of the NPL Differential Plane Mirror Optical Interferometer

Science.gov (United States)

Yacoot, Andrew; Downs, Michael J.

2000-08-01

The x-ray interferometer from the combined optical and x-ray interferometer (COXI) facility at NPL has been used to investigate the performance of the NPL Jamin Differential Plane Mirror Interferometer when it is fitted with stabilized and unstabilized lasers. This Jamin interferometer employs a common path design using a double pass configuration and one fringe is realized by a displacement of 158 nm between its two plane mirror retroreflectors. Displacements over ranges of several optical fringes were measured simultaneously using the COXI x-ray interferometer and the Jamin interferometer and the results were compared. In order to realize the highest measurement accuracy from the Jamin interferometer, the air paths were shielded to prevent effects from air turbulence and electrical signals generated by the photodetectors were analysed and corrected using an optimizing routine in order to subdivide the optical fringes accurately. When an unstabilized laser was used the maximum peak-to-peak difference between the two interferometers was 80 pm, compared with 20 pm when the stabilized laser was used.

Nano-structuring of multi-layer material by single x-ray vortex pulse with femtosecond duration

Science.gov (United States)

Kohmura, Yoshiki; Zhakhovsky, Vasily; Takei, Dai; Suzuki, Yoshio; Takeuchi, Akihisa; Inoue, Ichiro; Inubushi, Yuichi; Inogamov, Nail; Ishikawa, Tetsuya; Yabashi, Makina

2018-03-01

A narrow zero-intensity spot arising from an x-ray vortex has huge potential for future applications such as nanoscopy and nanofabrication. We here present an X-ray Free Electron Laser (XFEL) experiment with a focused vortex wavefront which generated high aspect ratio nanoneedles on a Cr/Au multi-layer (ML) specimen. A sharp needle with a typical width and height of 310 and 600 nm was formed with a high occurrence rate at the center of a 7.71 keV x-ray vortex on this ML specimen, respectively. The observed width exceeds the diffraction limit, and the smallest structures ever reported using an intense-XFEL ablation were fabricated. We found that the elemental composition of the nanoneedles shows a significant difference from that of the unaffected area of Cr/Au ML. All these results are well explained by the molecular dynamics simulations, leading to the elucidation of the needle formation mechanism on an ultra-fast timescale.

Compact tunable Compton x-ray source from laser-plasma accelerator and plasma mirror

International Nuclear Information System (INIS)

Tsai, Hai-En; Wang, Xiaoming; Shaw, Joseph M.; Li, Zhengyan; Zgadzaj, Rafal; Henderson, Watson; Downer, M. C.; Arefiev, Alexey V.; Zhang, Xi; Khudik, V.; Shvets, G.

2015-01-01

We present an in-depth experimental-computational study of the parameters necessary to optimize a tunable, quasi-monoenergetic, efficient, low-background Compton backscattering (CBS) x-ray source that is based on the self-aligned combination of a laser-plasma accelerator (LPA) and a plasma mirror (PM). The main findings are (1) an LPA driven in the blowout regime by 30 TW, 30 fs laser pulses produce not only a high-quality, tunable, quasi-monoenergetic electron beam, but also a high-quality, relativistically intense (a 0 ∼ 1) spent drive pulse that remains stable in profile and intensity over the LPA tuning range. (2) A thin plastic film near the gas jet exit retro-reflects the spent drive pulse efficiently into oncoming electrons to produce CBS x-rays without detectable bremsstrahlung background. Meanwhile, anomalous far-field divergence of the retro-reflected light demonstrates relativistic “denting” of the PM. Exploiting these optimized LPA and PM conditions, we demonstrate quasi-monoenergetic (50% FWHM energy spread), tunable (75–200 KeV) CBS x-rays, characteristics previously achieved only on more powerful laser systems by CBS of a split-off, counter-propagating pulse. Moreover, laser-to-x-ray photon conversion efficiency (∼6 × 10 −12 ) exceeds that of any previous LPA-based quasi-monoenergetic Compton source. Particle-in-cell simulations agree well with the measurements

Adjustment of a goniometer for X-rays optics calibration in the spectral range 1.5-20 KeV

International Nuclear Information System (INIS)

Legistre, S.

1992-10-01

The aim of this memoir is the adjustment of a (θ, 2θ) goniometer coupled to X-rays source to calibrate mirrors (single layers like C, Ni, Au, etc... and multilayers like C/W, Si/W, etc...) in the spectral range 1.5 - 20 keV. For each kind of tested optics the adjustment of the goniometer include the procedure alignment of the different components (X-ray source, collimation slits, optics, detectors) and the first reflectivity measurements. Those measurements are compared those realized at LURE, using synchrotron radiation provided by SUPER ACO storage ring, and to a theoretical simulation

Experimental studies of X-UV rays by a laser plasma: X-UV strioscopy by means of multilayer mirrors

International Nuclear Information System (INIS)

Lutrin, F.

1996-01-01

This thesis studies a new instrument -from its conception to the measures interpretation- that analyses electronic density gradient in the super critical transportation area of a laser plasma (0,35 μm). This device, so-called of X-UV Schlieren, is based on the refraction property of a probe beam by an index gradient. Its specificity is the use of the X-UV emission at 13 nm (92 eV) of another laser plasma as X-UV probe. The conception and characterization of this instrument are defined thanks to both the emissivity and reflectivity properties of laser plasmas and the reflectivity properties of multilayers. Within this report are presented strioscopy images, spatially and spectrally resolved of an aluminium plasma from a 3.10 12 W/cm 2 laser flux, probed by a 13 nm wavelength. The device has to be closely aligned so as to obtain good contrast and good spatial resolution. For the first time, the refraction of a X-UV probe beam by a laser plasma is displayed. The experiments show that this refraction is all the more obvious for a gold probe plasma of energy 105 J and an aluminium probed plasma of energy 1 J. According to our plasma hydrodynamic simulation, the detected refraction corresponds to an electronic density gradient of 6,5.10 25 electrons/cm 4 in the two first microns of the sur-critical area. To study the parameters dependence of this gradient in the sur-critical area, several solutions for improving the instrument are produced. (author)

Design optimization of ultra-precise elliptical mirrors for hard x-ray nanofocusing at Nanoscopium

Science.gov (United States)

Kewish, Cameron M.; Polack, François; Signorato, Riccardo; Somogyi, Andrea

2013-09-01

The design and implementation of a pair of 100 mm-long grazing-incidence total-reflection mirrors for the hard X-ray beamline Nanoscopium at Synchrotron Soleil is presented. A vertically and horizontally nanofocusing mirror pair, oriented in Kirkpatrick-Baez geometry, has been designed and fabricated with the aim of creating a diffraction-limited high-intensity 5 - 20 keV beam with a focal spot size as small as 50 nm. We describe the design considerations, including wave-optical calculations of figures-of-merit that are relevant for spectromicroscopy, such as the focal spot size, depth of field and integrated intensity. The mechanical positioning tolerance in the pitch angle that is required to avoid introducing high-intensity features in the neighborhood of the focal spot is demonstrated with simulations to be of the order of microradians, becoming tighter for shorter focal lengths and therefore directly affecting all nanoprobe mirror systems. Metrology results for the completed mirrors are presented, showing that better than 1.5 °A-rms figure error has been achieved over the full mirror lengths with respect to the designed elliptical surfaces, with less than 60 nrad-rms slope errors.

Quasi-kinoform type multilayer zone plate with high diffraction efficiency for high-energy X-rays

International Nuclear Information System (INIS)

Tamura, S; Yasumoto, M; Kamijo, N; Uesugi, K; Takeuchi, A; Terada, Y; Suzuki, Y

2009-01-01

Fresnel zone plate (FZP) with high diffraction efficiency leads to high performance X-ray microscopy with the reduction of the radiation damage to biological specimens. In order to attain high diffraction efficiency in high energy X-ray region, we have developed multilevel-type (6-step) multilayer FZPs with the diameter of 70 micron. The efficiencies of two FZPs were evaluated at the BL20XU beamline of SPring-8. For one FZP, the peak efficiency for the 1st-order diffraction of 51% has been obtained at 70 keV. The efficiencies higher than 40% have been achieved in the wide energy range of 70-90 keV. That for the 2nd-order diffraction of 46% has been obtained at 37.5 keV.

Silicon pore optics for the international x-ray observatory

Science.gov (United States)

Wille, E.; Wallace, K.; Bavdaz, M.; Collon, M. J.; Günther, R.; Ackermann, M.; Beijersbergen, M. W.; Riekerink, M. O.; Blom, M.; Lansdorp, B.; de Vreede, L.

2017-11-01

Lightweight X-ray Wolter optics with a high angular resolution will enable the next generation of X-ray telescopes in space. The International X-ray Observatory (IXO) requires a mirror assembly of 3 m2 effective area (at 1.5 keV) and an angular resolution of 5 arcsec. These specifications can only be achieved with a novel technology like Silicon Pore Optics, which is developed by ESA together with a consortium of European industry. Silicon Pore Optics are made of commercial Si wafers using process technology adapted from the semiconductor industry. We present the manufacturing process ranging from single mirror plates towards complete focusing mirror modules mounted in flight configuration. The performance of the mirror modules is tested using X-ray pencil beams or full X-ray illumination. In 2009, an angular resolution of 9 arcsec was achieved, demonstrating the improvement of the technology compared to 17 arcsec in 2007. Further development activities of Silicon Pore Optics concentrate on ruggedizing the mounting system and performing environmental tests, integrating baffles into the mirror modules and assessing the mass production.

X-Ray Optics at NASA Marshall Space Flight Center

Science.gov (United States)

O'Dell, Stephen L.; Atkins, Carolyn; Broadway, David M.; Elsner, Ronald F.; Gaskin, Jessica A.; Gubarev, Mikhail V.; Kilaru, Kiranmayee; Kolodziejczak, Jeffery J.; Ramsey, Brian D.; Roche, Jacqueline M.;

High-energy x-ray microscopy of laser-fusion plasmas at the National Ignition Facility

International Nuclear Information System (INIS)

Koch, J.A.; Landen, O.L.; Hammel, B.A.

1997-01-01

Multi-keV x-ray microscopy will be an important laser-produced plasma diagnostic at future megajoule facilities such as the National Ignition Facility (NIF).In preparation for the construction of this facility, we have investigated several instrumentation options in detail, and we conclude that near normal incidence single spherical or toroidal crystals may offer the best general solution for high-energy x-raymicroscopy at NIF and at similar large facilities. Kirkpatrick-Baez microscopes using multi-layer mirrors may also be good secondary options, particularly if apertures are used to increase the band-width limited field of view

Advanced laser-backlit grazing-incidence x-ray imaging systems for inertial confinement fusion research. II. Tolerance analysis

International Nuclear Information System (INIS)

Bennett, Guy R.; Folta, James A.

2001-01-01

Two example ultrahigh-spatial resolution laser-backlit grazing-incidence x-ray microscope designs for inertial confinement fusion (ICF) research have been described [Appl. Opt. 40, 4570 (2001)]. Here details of fabrication, assembly, and optical surface errors that are characteristic of present state-of-the-art superpolished multilayer-coated spherical mirrors are given. They indicate that good image qualities can be expected; in particular, <0.5-μm spatial resolution at very high x-ray energies (up to 25 keV) appears to be feasible. Existing ICF imaging diagnostics approach ∼2 μm spatial at low (<2 keV) energy. The improvement in resolution compared with that of other grazing-incidence devices is attributed to a fortuitous residual on-axis aberration dependence on short wavelengths; recent advances in mirror fabrication, including a new thin-film deposition technique to correct figure errors precisely in one dimension; and novel design. For even higher resolution, a means of creating precise aspherical mirrors of spheric-quality microroughness may be possible by use of the same deposition technique

SMART-X: Square Meter, Arcsecond Resolution Telescope for X-rays

Science.gov (United States)

Vikhlinin, Alexey; SMART-X Collaboration

2013-04-01

SMART-X is a concept for a next-generation X-ray observatory with large-area, 0.5" angular resolution grazing incidence adjustable X-ray mirrors, high-throughput critical angle transmission gratings, and X-ray microcalorimeter and CMOS-based imager in the focal plane. High angular resolution is enabled by new technology based on controlling the shape of mirror segments using thin film piezo actuators deposited on the back surface. Science applications include observations of growth of supermassive black holes since redshifts of ~10, ultra-deep surveys over 10's of square degrees, galaxy assembly at z=2-3, as well as new opportunities in the high-resolution X-ray spectroscopy and time domains. We also review the progress in technology development, tests, and mission design over the past year.

Alignment and Distortion-Free Integration of Lightweight Mirrors into Meta-Shells for High-Resolution Astronomical X-Ray Optics

Science.gov (United States)

Chan, Kai-Wing; Zhang, William W.; Schofield, Mark J.; Numata, Ai; Mazzarella, James R.; Saha, Timo T.; Biskach, Michael P.; McCelland, Ryan S.; Niemeyer, Jason; Sharpe, Marton V.;

X-ray imaging studies of electron cyclotron microwave-heated plasmas in the Tandem Mirror Experiment-Upgrade

International Nuclear Information System (INIS)

Failor, B.H.

1986-02-01

An x-ray pinhole camera designed to efficiently detect photons with energies between 5 and 250 keV was built to image bremsstrahlung emission from a microwave-heated hot electron plasma. This plasma is formed at one of the thermal barrier locations in the Tandem Experiment-Upgrade at Lawrence Livermore National Laboratory. The instrument consists of a lead aperture, an x-ray converter in the form of a sodium-activated cesium iodide scintillator, light intensifier electronics, and a recording medium that may either be high speed film or a CCD array. The nominal spatial and temporal resolutions are one part in 40 and 17 msec, respectively. The component requirements for optimum performance were determined both analytically and by computer simulation, and were verified experimentally. The details of these results are presented. The instrument has been used to measure x-ray emission from the TMX-U west end cell. Data acquired with the x-ray camera has allowed us to infer the temporal evolution of the mirror-trapped electron radial profile

Study of a high finesse four mirrors Fabry Perot cavity for X-rays and Gamma rays production by laser-electron Compton scattering

International Nuclear Information System (INIS)

Fedala, Y.

2008-10-01

The main goal of this thesis is the study and design of a high finesse Fabry Perot cavity to amplify a laser beam in order to achieve power gains ranging from 10 4 to 10 5 . This cavity is dedicated to the production of intense and monochromatic X-ray for medical applications (medical RADIOTHOMX ring) and gamma rays for a Compton based polarized positron source by Compton scattering of a high power laser beam and electron beam. To increase the brightness of the Compton interaction at the collision points, it is essential to have not only a high power laser beam but also very small laser beam radii at the interaction points. To achieve such performances, 2 scenarios are possible: a concentric 2 mirrors cavity which is mechanically unstable or a 4 mirrors cavity more complex but more stable. We tested numerically mechanical stability and stability of Eigen modes polarization of various planar and non-planar geometries of 4 mirrors cavities. Experimentally, we have developed a four mirrors tetrahedral 'bow-tie' cavity; radii of the order of 20 microns were made. The Eigen modes of such a cavity, in both planar and non planar geometries, were measured and compared with the numerical results. A good agreement was observed. In a second time, the impact of Compton interaction on the transverse dynamics, in the case of the polarized positrons source, and the longitudinal dynamic, in the case of the medical ring of the electron beam was studied. Compton scattering causes energy loss and induces an additional dispersion of energy in electron beam. For the polarized positrons source, 10 collision points are planned. The transport line has been determined and the modelling of the Compton interaction effect with a simple matrix calculation was made. For the medical ring, Compton scattering causes bunch lengthening and the increase of energy dispersion which are to influence the produced X-ray flux. A study of the longitudinal dynamics of the electron beam in the ring was

Direct and inverse problems of studying the properties of multilayer nanostructures based on a two-dimensional model of X-ray reflection and scattering

Science.gov (United States)

Khachaturov, R. V.

2014-06-01

A mathematical model of X-ray reflection and scattering by multilayered nanostructures in the quasi-optical approximation is proposed. X-ray propagation and the electric field distribution inside the multilayered structure are considered with allowance for refraction, which is taken into account via the second derivative with respect to the depth of the structure. This model is used to demonstrate the possibility of solving inverse problems in order to determine the characteristics of irregularities not only over the depth (as in the one-dimensional problem) but also over the length of the structure. An approximate combinatorial method for system decomposition and composition is proposed for solving the inverse problems.

Prospects for supermirrors in hard x-ray spectroscopy

DEFF Research Database (Denmark)

Joensen, Karsten D.; Gorenstein, Paul; Christensen, Finn Erland

1994-01-01

. The measured x-ray reflectivities are well accounted for by the standard dynamical theories of multilayer reflection. Hard x ray applications that could benefit from x-ray supermirror coatings include focusing and imaging instrumentation for astrophysics, collimating and focusing devices for synchrotron...

X-ray pore optic developments

Science.gov (United States)

Wallace, Kotska; Bavdaz, Marcos; Collon, Maximilien; Beijersbergen, Marco; Kraft, Stefan; Fairbend, Ray; Séguy, Julien; Blanquer, Pascal; Graue, Roland; Kampf, Dirk

2017-11-01

In support of future x-ray telescopes ESA is developing new optics for the x-ray regime. To date, mass and volume have made x-ray imaging technology prohibitive to planetary remote sensing imaging missions. And although highly successful, the mirror technology used on ESA's XMM-Newton is not sufficient for future, large, x-ray observatories, since physical limits on the mirror packing density mean that aperture size becomes prohibitive. To reduce telescope mass and volume the packing density of mirror shells must be reduced, whilst maintaining alignment and rigidity. Structures can also benefit from a modular optic arrangement. Pore optics are shown to meet these requirements. This paper will discuss two pore optic technologies under development, with examples of results from measurement campaigns on samples. One activity has centred on the use of coated, silicon wafers, patterned with ribs, that are integrated onto a mandrel whose form has been polished to the required shape. The wafers follow the shape precisely, forming pore sizes in the sub-mm region. Individual stacks of mirrors can be manufactured without risk to, or dependency on, each other and aligned in a structure from which they can also be removed without hazard. A breadboard is currently being built to demonstrate this technology. A second activity centres on glass pore optics. However an adaptation of micro channel plate technology to form square pores has resulted in a monolithic material that can be slumped into an optic form. Alignment and coating of two such plates produces an x-ray focusing optic. A breadboard 20cm aperture optic is currently being built.

Multimodal hard x-ray nanoprobe facility by nested Montel mirrors aimed for 40nm resolution at Taiwan Photon Source

Energy Technology Data Exchange (ETDEWEB)

Yin, Gung-Chian, E-mail: gcyin@nsrrc.org.tw; Chang, Shi-Hung; Chen, Bo-Yi; Chen, Huang-Yeh; Lin, Bi-Hsuan; Tseng, Shao-Chin; Lee, Chian-Yao; Tang, Mau-Tsu [National Synchrotron Radiation Research Center, Hsinchu 30076, Taiwan (China); Wu, Shao-Yun [National Tsing-Hua University, Hsinchu 30076, Taiwan (China)

2016-01-28

The hard X-ray nanoprobe facility at Taiwan Photon Source (TPS) provides multimodal X-ray detections, including XRF, XAS, XEOL, projection microscope, CDI, etc. Resulting from the large numerical aperture obtained by utilizing nested Montel mirrors, the beamline with a moderate length 75 meters can conduct similar performance with those beamlines longer than 100 meters. The mirrors are symmetrically placed with a 45 degrees cut. The beamline optics is thus designed to take the advantage of the symmetry of mirrors such that a round focal spot is accomplished. The size and the divergence of the focus spot are simulated around 40 nm and 6.29 mrad, respectively. The whole facility including the beamline and the stations will be operated under vacuum to preserve the photon coherence as well as to prevent the system from unnecessary environmental interference. A SEM in close cooperation with laser interferometers is equipped to precisely locate the position of the sample. This endstation is scheduled to be commissioned in the fall of 2016.

X-ray beam-shaping via deformable mirrors: surface profile and point spread function computation for Gaussian beams using physical optics.

Science.gov (United States)

Spiga, D

2018-01-01

X-ray mirrors with high focusing performances are commonly used in different sectors of science, such as X-ray astronomy, medical imaging and synchrotron/free-electron laser beamlines. While deformations of the mirror profile may cause degradation of the focus sharpness, a deliberate deformation of the mirror can be made to endow the focus with a desired size and distribution, via piezo actuators. The resulting profile can be characterized with suitable metrology tools and correlated with the expected optical quality via a wavefront propagation code or, sometimes, predicted using geometric optics. In the latter case and for the special class of profile deformations with monotonically increasing derivative, i.e. concave upwards, the point spread function (PSF) can even be predicted analytically. Moreover, under these assumptions, the relation can also be reversed: from the desired PSF the required profile deformation can be computed analytically, avoiding the use of trial-and-error search codes. However, the computation has been so far limited to geometric optics, which entailed some limitations: for example, mirror diffraction effects and the size of the coherent X-ray source were not considered. In this paper, the beam-shaping formalism in the framework of physical optics is reviewed, in the limit of small light wavelengths and in the case of Gaussian intensity wavefronts. Some examples of shaped profiles are also shown, aiming at turning a Gaussian intensity distribution into a top-hat one, and checks of the shaping performances computing the at-wavelength PSF by means of the WISE code are made.

Correlation methods in optical metrology with state-of-the-art x-ray mirrors

Science.gov (United States)

Yashchuk, Valeriy V.; Centers, Gary; Gevorkyan, Gevork S.; Lacey, Ian; Smith, Brian V.

2018-01-01

The development of fully coherent free electron lasers and diffraction limited storage ring x-ray sources has brought to focus the need for higher performing x-ray optics with unprecedented tolerances for surface slope and height errors and roughness. For example, the proposed beamlines for the future upgraded Advance Light Source, ALS-U, require optical elements characterized by a residual slope error of optics with a length of up to one meter. However, the current performance of x-ray optical fabrication and metrology generally falls short of these requirements. The major limitation comes from the lack of reliable and efficient surface metrology with required accuracy and with reasonably high measurement rate, suitable for integration into the modern deterministic surface figuring processes. The major problems of current surface metrology relate to the inherent instrumental temporal drifts, systematic errors, and/or an unacceptably high cost, as in the case of interferometry with computer-generated holograms as a reference. In this paper, we discuss the experimental methods and approaches based on correlation analysis to the acquisition and processing of metrology data developed at the ALS X-Ray Optical Laboratory (XROL). Using an example of surface topography measurements of a state-of-the-art x-ray mirror performed at the XROL, we demonstrate the efficiency of combining the developed experimental correlation methods to the advanced optimal scanning strategy (AOSS) technique. This allows a significant improvement in the accuracy and capacity of the measurements via suppression of the instrumental low frequency noise, temporal drift, and systematic error in a single measurement run. Practically speaking, implementation of the AOSS technique leads to an increase of the measurement accuracy, as well as the capacity of ex situ metrology by a factor of about four. The developed method is general and applicable to a broad spectrum of high accuracy measurements.

Analysis of the relative movement between mirrors and detectors for the next generation x-ray telescopes

Science.gov (United States)

Civitani, Marta

2009-08-01

Focusing X-ray telescopes with imaging capabilities, like SIMBOL-X, HEXISAT and IXO, are characterized by very long focal lengths, greater than 10m. The constraints posed by the launchers on the maximum dimensions of a payload, make necessary using alternatives to monolithic telescopes. One possibility is that the mirror and the detectors are carried by two separate spacecrafts that fly in formation. Another is placing the detector module on a bench that will be extended once in final orbit. In both the case the system will be subjected to deformation due the relative movement of the mirrors with respect to detectors. In one case the deformation will be due to the correction on the position and attitude of the detector spacecraft to maintain the formation with the mirror spacecraft, while in the other to oscillations of the detectors on the top of the bench. The aim of this work is to compare the behavior of the system in the two different configurations and to evaluate the performances of the on board metrology systems needed not to degrade the telescope angular resolution.

On the Compliance of Simbol-X Mirror Roughness with its Effective Area Requirements

Science.gov (United States)

Spiga, D.; Basso, S.; Cotroneo, V.; Pareschi, G.; Tagliaferri, G.

2009-05-01

Surface microroughness of X-ray mirrors is a key issue for the angular resolution of Simbol-X to comply with the required one (Simbol-X mirrors, in order to satisfy the required imaging capability, has already been derived in terms of its PSD (Power Spectral Density). However, also the Effective Area of the telescope is affected by the mirror roughness. In this work we will show how the expected effective area of the Simbol-X mirror module can be computed from the roughness PSD tolerance, checking its compliance with the requirements.

Multilayered samples reconstructed by measuring K{sub α}/K{sub β} or L{sub α}/L{sub β} X-ray intensity ratios by EDXRF

Energy Technology Data Exchange (ETDEWEB)

Cesareo, Roberto, E-mail: cesareo@uniss.it [Istituto per lo Studio dei Materiali Nano Strutturati, CNR-Montelibretti, via Salaria km. 29.5, 00015 Monterotondo (Romania); Assis, Joaquim T. de, E-mail: joaquim.iprj@gmail.com [Universidade do Estado do Rio de Janeiro, Instituto Politécnico, P.O. Box 97282, 28625-570 Nova Friburgo, RJ (Brazil); Roldán, Clodoaldo, E-mail: Clodoaldo.Roldan@uv.es [Instituto de Ciencia de los Materiales, Universidad de Valencia, P.O. Box 22085, E46071 Valencia (Spain); Bustamante, Angel D., E-mail: angelbd1@gmail.com [Universidad Nacional Mayor de San Marcos, Lima (Peru); Brunetti, Antonio, E-mail: brunetti@uniss.it [Dipartimento di Scienze Politiche, Scienza della Comunicazione e Ingegneria dell’ Informazione, Università di Sassari, Sassari (Italy); Schiavon, Nick [Hercules Laboratory and Évora Geophysical Centre, University of Evora (Portugal)

2013-10-01

In this paper a general method based on energy-dispersive X-ray fluorescence (EDXRF) analysis has been tested to assess its possible use as a tool to reconstruct the structure and determine the thickness of two and/or multi-layered materials. The method utilizes the X-ray intensity ratios of K{sub α}/K{sub β} or L{sub α}/L{sub β} peaks (or the ratio of these peaks) for selected elements present in multi-layered objects of various materials (Au alloys, gilded Cu, gilded Ag, gilded Pb, Ag–Au Tumbaga, stone surfaces with protective treatments, Zn or Nickel plating on metals). Results show that, in the case of multi-layered samples, a correct calculation of the peak ratio (K{sub α} /K{sub β} and/or L{sub α}/L{sub β}) of relevant elements from energy-dispersive X-ray fluorescence spectra, can provide important information in assessing the exact location of each layer and for calculating its thickness. The methodological approach shown may have important applications not only in materials science but also when dealing with the conservation and restoration of multi-layered cultural heritage objects where the use of a Non-Destructive techniques to determine slight chemical and thickness variations in the layered structure is often of paramount importance to achieve the best results.

Multi-layer thickness determination using differential-based enhanced Fourier transforms of X-ray reflectivity data

Energy Technology Data Exchange (ETDEWEB)

Poust, Benjamin [Department of Materials Science and Engineering, University of California, Los Angeles, CA (United States); Northrop Grumman Space Technology, Redondo Beach, CA (United States); Sandhu, Rajinder [Northrop Grumman Space Technology, Redondo Beach, CA (United States); Goorsky, Mark [Department of Materials Science and Engineering, University of California, Los Angeles, CA (United States)

2009-08-15

Layer thickness determination of single and multi-layer structures is achieved using a new method for generating Fourier transforms (FTs) of X-ray reflectivity data. This enhanced Fourier analysis is compared to other techniques in the determination of AlN layer thickness deposited on sapphire. In addition to demonstrably improved results, the results also agree with thicknesses determined using simulations and TEM measurements. The effectiveness of the technique is further demonstrated using the more complicated metamorphic epitaxial multi-layer AlSb/InAs structures deposited on GaAs. The approach reported here is based upon differentiating the specular intensity with respect to the vertical reciprocal space coordinate Q{sub Z}. In general, differentiation is far more effective at removing the sloping background present in reflectivity scans than logarithmic compression alone, average subtraction alone, or other methods. When combined with any of the other enhancement techniques, however, differentiation yields distinguishable discrete Fourier transform (DFT) power spectrum peaks for even the weakest and most truncated of sloping oscillations that are present in many reflectivity scans from multi-layer structures. (Abstract Copyright [2009], Wiley Periodicals, Inc.)

On the Compliance of Simbol-X Mirror Roughness with its Effective Area Requirements

International Nuclear Information System (INIS)

Spiga, D.; Basso, S.; Cotroneo, V.; Pareschi, G.; Tagliaferri, G.

2009-01-01

Surface microroughness of X-ray mirrors is a key issue for the angular resolution of Simbol-X to comply with the required one (<20 arcsec at 30 keV). The maximum tolerable microroughness for Simbol-X mirrors, in order to satisfy the required imaging capability, has already been derived in terms of its PSD (Power Spectral Density). However, also the Effective Area of the telescope is affected by the mirror roughness. In this work we will show how the expected effective area of the Simbol-X mirror module can be computed from the roughness PSD tolerance, checking its compliance with the requirements.

Understanding the performance of x-ray mirrors

International Nuclear Information System (INIS)

Takacs, P.Z.

1989-01-01

The manufacture of x-ray mirrors is a rather specialized branch of the optical fabrication industry. As those who have had to deal with the procurement of these components well know, there are only a handful of optical companies who supply most of the grazing incidence optics in use at the synchrotron light source facilities in this country. There is relatively little information available of practical use to guide the user through any of the above steps. We have been ''forced'' to develop our own foundation for assessing the performance of various vendors and determining the quality of the components produced by them. Our approach has been to concentrate on the area of metrology of grazing incidence optics and to develop instruments and techniques that can be used to improve the quality of components delivered to us. The major problem hindering the production of grazing incidence optics is the lack of specialized metrology instrumentation that can be used by the small manufacturing shop to assess the quality of the component under production. We have been engaged over the past several years in developing the theoretical framework and practical measurement techniques to link the metrology to actual performance, providing much-needed feedback to the manufacture and also educating users and manufacturers in the proper understanding of the language of surface figure and finish metrology

Numerical controlled diamond fly cutting machine for grazing incidence X-ray reflection mirrors

International Nuclear Information System (INIS)

Uchida, Fumihiko; Moriyama, Shigeo; Seya, Eiiti

1992-01-01

Synchrotron radiation has reached the stage of practical use, and the application to the wide fields that support future advanced technologies such as spectroscopy, the structural analysis of matters, semiconductor lithography and medical light source is expected. For the optical system of the equipment utilizing synchrotron radiation, the total reflection mirrors of oblique incidence are used for collimating and collecting X-ray. In order to restrain their optical aberration, nonspherical shape is required, and as the manufacturing method with high precision for nonspherical mirrors, a numerically controlled diamond cutting machine was developed. As for the cutting of soft metals with diamond tools, the high precision machining of any form can be done by numerical control, the machining time can be reduced as compared with grinding, and the cooling effect is large in metals. The construction of the cutting machine, the principle of machining, the control system, the method of calculating numerical control data, the investigation of machinable forms and the result of evaluation are reported. (K.I.)

Laser plasma soft x-ray microscope with Wolter mirrors for observation of biological specimens in air

International Nuclear Information System (INIS)

Hoshino, Masato; Aoki, Sadao

2006-01-01

A laser plasma soft X-ray microscope with Wolter mirrors was developed so that specimens could be set in the atmosphere. Silicon nitride membranes 100 nm thick were used as vacuum-tight windows. Using relatively large windows (0.46 x 0.46 mm 2 ), an adequate working distance for samples, which was approximately 1.2 mm, was assured. The endrance of the vacuum-tight window was measured briefly. Dry biological cells could be observed with resolution better than 100 nm. A preliminary observation of wet biological cells was carried out using a wet environmental sample holder which was composed of only two sheets of silicon nitride membrane. An X-ray micrograph of wet red blood cells from a chicken was obtained without apparent effects of radiation damage. The properties of a vacuum-tight window and a wet sample holder are discussed. (author)

Magnetic properties of Co/Rh (001) multilayers studied by x-ray magnetic-circular dichroism

Science.gov (United States)

Tomaz, M. A.; Mayo, E.; Lederman, D.; Hallin, E.; Sham, T. K.; O'brien, W. L.; Harp, G. R.

1998-11-01

The layer-averaged magnetic moments of Co and Rh have been measured in sputter deposited Co/Rh (001) multilayer thin films using the x-ray magnetic circular dichroism. The Rh moments were measured at both the L and M absorption edges, where we find that the Rh moment decreases as a function of increasing Rh layer thickness (tRh). The decline of the layer-averaged Rh moment is well described in terms of a simple dilution, implying that the Rh moment is confined to the interfacial region. We find that the Co moment remains largely unaffected, maintaining a bulklike value of 1.7μB in the region preceding the first antiferromagnetic coupling peak where tRh ranges from 0 to 4 Å. We also find, via application of the dichroism sum rules, that the ratio / for Co increases ~10% for this same region. Finally, we contrast the magnetic behavior of the Co/Rh (001) and Fe/Rh (001) multilayer systems.

Fe/Rh (100) multilayer magnetism probed by x-ray magnetic circular dichroism

Science.gov (United States)

Tomaz, M. A.; Ingram, D. C.; Harp, G. R.; Lederman, D.; Mayo, E.; O'brien, W. L.

1997-09-01

We report the layer-averaged magnetic moments of both Fe and Rh in sputtered Fe/Rh (100) multilayer thin films as measured by x-ray magnetic circular dichroism. We observe two distinct regimes in these films. The first is characterized by Rh moments of at least 1μB, Fe moments enhanced as much as 30% above bulk, and a bct crystal structure. The second regime is distinguished by sharp declines of both Fe and Rh moments accompanied by a transition to an fct crystal lattice. The demarcation between the two regions is identified as the layer thickness for which both bct and fct phases first coexist, which we term the critical thickness tcrit. We attribute the change in magnetic behavior to the structural transformation.

Optics for coherent X-ray applications

Energy Technology Data Exchange (ETDEWEB)

Yabashi, Makina, E-mail: yabashi@spring8.or.jp [RIKEN SPring-8 Center, Kouto 1-1-1, Sayo, Hyogo 679-5148 (Japan); Tono, Kensuke [Japan Synchrotron Radiation Research Institute (JASRI), Kouto 1-1-1, Sayo, Hyogo 679-5198 (Japan); Mimura, Hidekazu [The University of Tokyo, Hongo 7-3-1, Bunkyo-ku, Tokyo 113-8656 (Japan); Matsuyama, Satoshi; Yamauchi, Kazuto [Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871 (Japan); Tanaka, Takashi; Tanaka, Hitoshi; Tamasaku, Kenji [RIKEN SPring-8 Center, Kouto 1-1-1, Sayo, Hyogo 679-5148 (Japan); Ohashi, Haruhiko; Goto, Shunji [Japan Synchrotron Radiation Research Institute (JASRI), Kouto 1-1-1, Sayo, Hyogo 679-5198 (Japan); Ishikawa, Tetsuya [RIKEN SPring-8 Center, Kouto 1-1-1, Sayo, Hyogo 679-5148 (Japan)

2014-08-27

Developments of optics for coherent X-ray applications and their role in diffraction-limited storage rings are described. Developments of X-ray optics for full utilization of diffraction-limited storage rings (DLSRs) are presented. The expected performance of DLSRs is introduced using the design parameters of SPring-8 II. To develop optical elements applicable to manipulation of coherent X-rays, advanced technologies on precise processing and metrology were invented. With propagation-based coherent X-rays at the 1 km beamline of SPring-8, a beryllium window fabricated with the physical-vapour-deposition method was found to have ideal speckle-free properties. The elastic emission machining method was utilized for developing reflective mirrors without distortion of the wavefronts. The method was further applied to production of diffraction-limited focusing mirrors generating the smallest spot size in the sub-10 nm regime. To enable production of ultra-intense nanobeams at DLSRs, a low-vibration cooling system for a high-heat-load monochromator and advanced diagnostic systems to characterize X-ray beam properties precisely were developed. Finally, new experimental schemes for combinative nano-analysis and spectroscopy realised with novel X-ray optics are discussed.

Experimental study for the feasibility of using hard x-rays for micro-XRF analysis of multilayered metals

Energy Technology Data Exchange (ETDEWEB)

Polese, C., E-mail: claudia.polese@lnf.infn.it; Dabagov, S. B.; Esposito, A.; Hampai, D.; Gorghinian, A.; Liedl, A. [LNF - INFN, Via E. Fermi 40, I-00044 Frascati (Italy); Ferretti, M. [ITABC - CNR, Via Salaria km 29.300, 00016 Montelibretti (Italy)

2014-07-15

Application of polycapillary optical systems to improve a spatial resolution for the μ-XRF analysis by focusing a primary x-ray beam and/or by collecting fluorescence emission is well known. The challenge is to optimize them in combination with x-ray source for exciting K-lines above 20 keV that could allow characterization of many materials composed by heavy elements. To pursue this goal, preliminary studies on possible polycapillary lens employment in thickness determination for multilayer metal materials will be presented in this work. In this paper, the results of first attempts of integrating PyMCA with Monte Carlo simulation code (XMI-MSIM) that takes into account the secondary fluorescence effects on quantitative analysis of homogeneous matrices, in particular, metal alloys, are presented.

A one-dimensional ion beam figuring system for x-ray mirror fabrication

International Nuclear Information System (INIS)

Idir, Mourad; Huang, Lei; Bouet, Nathalie; Kaznatcheev, Konstantine; Vescovi, Matthew; Lauer, Ken; Conley, Ray; Rennie, Kent; Kahn, Jim; Nethery, Richard; Zhou, Lin

2015-01-01

We report on the development of a one-dimensional Ion Beam Figuring (IBF) system for x-ray mirror polishing. Ion beam figuring provides a highly deterministic method for the final precision figuring of optical components with advantages over conventional methods. The system is based on a state of the art sputtering deposition system outfitted with a gridded radio frequency inductive coupled plasma ion beam source equipped with ion optics and dedicated slit developed specifically for this application. The production of an IBF system able to produce an elongated removal function rather than circular is presented in this paper, where we describe in detail the technical aspect and present the first obtained results

A one-dimensional ion beam figuring system for x-ray mirror fabrication

Energy Technology Data Exchange (ETDEWEB)

Idir, Mourad, E-mail: midir@bnl.gov; Huang, Lei; Bouet, Nathalie; Kaznatcheev, Konstantine; Vescovi, Matthew; Lauer, Ken [NSLS-II, Brookhaven National Laboratory, P.O. Box 5000, Upton, New York 11973 (United States); Conley, Ray [Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States); Rennie, Kent; Kahn, Jim; Nethery, Richard [Kaufman & Robinson, Inc., 1330 Blue Spruce Drive, Fort Collins, Colorado 80524 (United States); Zhou, Lin [College of Mechatronics and Automation, National University of Defense Technology, 109 Deya Road, Changsha, Hunan 410073 (China); Hu’nan Key Laboratory of Ultra-precision Machining Technology, Changsha, Hunan 410073 (China)

2015-10-15

We report on the development of a one-dimensional Ion Beam Figuring (IBF) system for x-ray mirror polishing. Ion beam figuring provides a highly deterministic method for the final precision figuring of optical components with advantages over conventional methods. The system is based on a state of the art sputtering deposition system outfitted with a gridded radio frequency inductive coupled plasma ion beam source equipped with ion optics and dedicated slit developed specifically for this application. The production of an IBF system able to produce an elongated removal function rather than circular is presented in this paper, where we describe in detail the technical aspect and present the first obtained results.

Reflectance Tuning at Extreme Ultraviolet (EUV) Wavelengths with Active Multilayer Mirrors

NARCIS (Netherlands)

Bayraktar, Muharrem; Lee, Christopher James; van Goor, F.A.; Koster, Gertjan; Rijnders, Augustinus J.H.M.; Bijkerk, Frederik

2011-01-01

At extreme ultraviolet (EUV) wavelengths the refractive power of transmission type optical components is limited, therefore reflective components are used. Reflective optics (multilayer mirrors) usually consist of many bilayers and each bilayer is composed of a high and a low refractive index

Affordable and Lightweight High-Resolution X-ray Optics for Astronomical Missions

Science.gov (United States)

Zhang, W. W.; Biskach, M. P.; Bly, V. T.; Carter, J. M.; Chan, K. W.; Gaskin, J. A.; Hong, M.; Hohl, B. R.; Jones, W. D.; Kolodziejczak, J. J.

2014-01-01

Future x-ray astronomical missions require x-ray mirror assemblies that provide both high angular resolution and large photon collecting area. In addition, as x-ray astronomy undertakes more sensitive sky surveys, a large field of view is becoming increasingly important as well. Since implementation of these requirements must be carried out in broad political and economical contexts, any technology that meets these performance requirements must also be financially affordable and can be implemented on a reasonable schedule. In this paper we report on progress of an x-ray optics development program that has been designed to address all of these requirements. The program adopts the segmented optical design, thereby is capable of making both small and large mirror assemblies for missions of any size. This program has five technical elements: (1) fabrication of mirror substrates, (2) coating, (3) alignment, (4) bonding, and (5) mirror module systems engineering and testing. In the past year we have made progress in each of these five areas, advancing the angular resolution of mirror modules from 10.8 arc-seconds half-power diameter reported (HPD) a year ago to 8.3 arc-seconds now. These mirror modules have been subjected to and passed all environmental tests, including vibration, acoustic, and thermal vacuum. As such this technology is ready for implementing a mission that requires a 10-arc-second mirror assembly. Further development in the next two years would make it ready for a mission requiring a 5-arc-second mirror assembly. We expect that, by the end of this decade, this technology would enable the x-ray astrophysical community to compete effectively for a major x-ray mission in the 2020s that would require one or more 1-arc-second mirror assemblies for imaging, spectroscopic, timing, and survey studies.

Silicon pore optics for future x-ray telescopes

Science.gov (United States)

Wille, Eric; Bavdaz, Marcos; Wallace, Kotska; Shortt, Brian; Collon, Maximilien; Ackermann, Marcelo; Günther, Ramses; Olde Riekerink, Mark; Koelewijn, Arenda; Haneveld, Jeroen; van Baren, Coen; Erhard, Markus; Kampf, Dirk; Christensen, Finn; Krumrey, Michael; Freyberg, Michael; Burwitz, Vadim

2017-11-01

Lightweight X-ray Wolter optics with a high angular resolution will enable the next generation of X-ray telescopes in space. The candidate mission ATHENA (Advanced Telescope for High Energy Astrophysics) required a mirror assembly of 1 m2 effective area (at 1 keV) and an angular resolution of 10 arcsec or better. These specifications can only be achieved with a novel technology like Silicon Pore Optics, which is being developed by ESA together with a consortium of European industry. Silicon Pore Optics are made of commercial Si wafers using process technology adapted from the semiconductor industry. We present the recent upgrades made to the manufacturing processes and equipment, ranging from the manufacture of single mirror plates towards complete focusing mirror modules mounted in flight configuration, and results from first vibration tests. The performance of the mirror modules is tested at X-ray facilities that were recently extended to measure optics at a focal distance up to 20 m.

Replicated x-ray optics for space applications

Science.gov (United States)

Hudec, René; Pína, Ladislav; Inneman, Adolf

2017-11-01

We report on the program of design and development of X-ray optics for space applications in the Czech Republic. Having more than 30 years background in X-ray optics development for space applications (for use in astronomical X-ray telescopes onboard spacecrafts, before 1989 mostly for Soviet and East European INTERKOSMOS program), we focus nowadays on novel technologies and approaches, thin shell replicated mirrors, as well as studies of light-weight mirrors based on innovative materials such as ceramics. The collaboration includes teams from the Academy of Sciences, Universities, and industry. We will describe and discuss both the history of the development of Xray optics in the Czech Republic and the developed technologies and approaches (with focus on replication technology) as well as recent activities and developments including our participation on the ESA XEUS mirror technology development based on the Agreement between ESA and Czech Government.

BeatMark Software to Reduce the Cost of X-Ray Mirror Fabrication by Optimization of Polishing and Metrology cycle, Phase II

Data.gov (United States)

National Aeronautics and Space Administration — For X-Ray optics, polishing the mirrors is one of the most costly steps in the fabrication of the system. BeatMark software will significantly decrease the cost of...

Lifting the veil on the X-ray universe

Science.gov (United States)

1999-11-01

ESA's X-ray Multi Mirror mission - XMM - is the second Cornerstone in ESA's Long Term Scientific Programme (*). This new X-ray space telescope promises even more discoveries. With the large collecting area of its mirrors and the high sensitivity of its cameras, XMM is expected to increase radically our understanding of high-energy sources - clues to a mysterious past, and keys to understanding the future of the Universe. 174 wafer-thin X-ray mirrors X-rays coming from celestial objects are highly energetic and elusive. They can best be measured and studied after focusing a sufficient number upon sensitive detectors. To achieve this, XMM's Mirror Modules have been given a gargantuan appetite for X-rays. The space observatory combines three barrel-shaped telescope modules. In each are nested 58 wafer-thin concentric mirror shells highly polished and subtly shaped. Passing through at an extremely shallow angle, the so-called "grazing incidence", the X-rays will be beamed to the science instruments situated on the focal plane at the other extremity of the satellite. The three mirror modules have a total mirror surface of over 120m2 - practically the size of a tennis court.. The collecting power of XMM's three telescopes is the greatest ever seen on an X-ray space mission, many times more than the most recently launched X-ray satellite. The design and assembly of the mirror modules, their testing for operation in space and their precise calibration constitute one of the greatest achievements of the XMM programme. The flimsy mirror shells, with their gold reflective surface on a nickel backing, were made by replication like carbon copies from master moulds. They were shaped to an accuracy of a thousandth of a millimetre, and then polished to a smoothness a thousand times better than that. Packaged one within another like Russian dolls, each mirror was focused and centred with respect to its neighbour to an accuracy of 25 microns - a quarter of the width of a human hair

The Ferrara hard X-ray facility for testing/calibrating hard X-ray focusing telescopes

Science.gov (United States)

Loffredo, Gianluca; Frontera, Filippo; Pellicciotta, Damiano; Pisa, Alessandro; Carassiti, Vito; Chiozzi, Stefano; Evangelisti, Federico; Landi, Luca; Melchiorri, Michele; Squerzanti, Stefano

2005-12-01

We will report on the current configuration of the X-ray facility of the University of Ferrara recently used to perform reflectivity tests of mosaic crystals and to calibrate the experiment JEM X aboard Integral. The facility is now located in the technological campus of the University of Ferrara in a new building (named LARIX laboratory= LARge Italian X-ray facility) that includes a tunnel 100 m long with, on the sides, two large experimental rooms. The facility is being improved for determining the optical axis of mosaic crystals in Laue configuration, for calibrating Laue lenses and hard X-ray mirror prototypes.

Experimental study for the feasibility of using hard x-rays for micro-XRF analysis of multilayered metals

Directory of Open Access Journals (Sweden)

C. Polese

2014-07-01

Full Text Available Application of polycapillary optical systems to improve a spatial resolution for the μ-XRF analysis by focusing a primary x-ray beam and/or by collecting fluorescence emission is well known. The challenge is to optimize them in combination with x-ray source for exciting K-lines above 20 keV that could allow characterization of many materials composed by heavy elements. To pursue this goal, preliminary studies on possible polycapillary lens employment in thickness determination for multilayer metal materials will be presented in this work. In this paper, the results of first attempts of integrating PyMCA with Monte Carlo simulation code (XMI-MSIM that takes into account the secondary fluorescence effects on quantitative analysis of homogeneous matrices, in particular, metal alloys, are presented.

Grazing Incidence Wavefront Sensing and Verification of X-Ray Optics Performance

Science.gov (United States)

Saha, Timo T.; Rohrbach, Scott; Zhang, William W.

2011-01-01

Evaluation of interferometrically measured mirror metrology data and characterization of a telescope wavefront can be powerful tools in understanding of image characteristics of an x-ray optical system. In the development of soft x-ray telescope for the International X-Ray Observatory (IXO), we have developed new approaches to support the telescope development process. Interferometrically measuring the optical components over all relevant spatial frequencies can be used to evaluate and predict the performance of an x-ray telescope. Typically, the mirrors are measured using a mount that minimizes the mount and gravity induced errors. In the assembly and mounting process the shape of the mirror segments can dramatically change. We have developed wavefront sensing techniques suitable for the x-ray optical components to aid us in the characterization and evaluation of these changes. Hartmann sensing of a telescope and its components is a simple method that can be used to evaluate low order mirror surface errors and alignment errors. Phase retrieval techniques can also be used to assess and estimate the low order axial errors of the primary and secondary mirror segments. In this paper we describe the mathematical foundation of our Hartmann and phase retrieval sensing techniques. We show how these techniques can be used in the evaluation and performance prediction process of x-ray telescopes.

A development of laser-plasma-based soft x-ray microscope system

International Nuclear Information System (INIS)

Nam, Ki Yong; Kim, Kyong Woo; Kim, Kyu Gyeom; Kwon, Young Man; Yoon, Kwon Ha

2003-01-01

Soft x-ray nano-imaging microscopy system for biomedical application with a high resolution about 50 nm has been designed and described, and its integrated techniques also have been studied. The system is mainly composed of soft x-ray generation system, nano-scaled control system, x-ray optical device like a condenser or object mirror, a CCD camera coupled with multichannel plate (MCP) and vacuum system. In the system, soft x-ray is generated from the laser-based plasma by focusing Nd:YAG laser beam on tantalum (Ta) target. In an x-ray optical system, a wolter mirror has been considering condensing the x-ray beam on a biological specimen and zone plate was adapted as an object mirror. A Si 3 N 4 was used as specimen holder for keeping a biological sample alive in atmosphere conditions. A back-illuminated-CCD camera coupled with multichannel plate was determined to set up.

A development of laser-plasma-based soft x-ray microscope system

Energy Technology Data Exchange (ETDEWEB)

Nam, Ki Yong; Kim, Kyong Woo; Kim, Kyu Gyeom; Kwon, Young Man; Yoon, Kwon Ha [X-ray Microscopy Research Center, Wonkwang University, Iksan (Korea, Republic of)

2003-07-01

Soft x-ray nano-imaging microscopy system for biomedical application with a high resolution about 50 nm has been designed and described, and its integrated techniques also have been studied. The system is mainly composed of soft x-ray generation system, nano-scaled control system, x-ray optical device like a condenser or object mirror, a CCD camera coupled with multichannel plate (MCP) and vacuum system. In the system, soft x-ray is generated from the laser-based plasma by focusing Nd:YAG laser beam on tantalum (Ta) target. In an x-ray optical system, a wolter mirror has been considering condensing the x-ray beam on a biological specimen and zone plate was adapted as an object mirror. A Si{sub 3}N{sub 4} was used as specimen holder for keeping a biological sample alive in atmosphere conditions. A back-illuminated-CCD camera coupled with multichannel plate was determined to set up.

Advanced materials for multilayer mirrors for extreme ultraviolet solar astronomy.

Science.gov (United States)

Bogachev, S A; Chkhalo, N I; Kuzin, S V; Pariev, D E; Polkovnikov, V N; Salashchenko, N N; Shestov, S V; Zuev, S Y

2016-03-20

We provide an analysis of contemporary multilayer optics for extreme ultraviolet (EUV) solar astronomy in the wavelength ranges: λ=12.9-13.3  nm, λ=17-21  nm, λ=28-33  nm, and λ=58.4  nm. We found new material pairs, which will make new spaceborne experiments possible due to the high reflection efficiencies, spectral resolution, and long-term stabilities of the proposed multilayer coatings. In the spectral range λ=13  nm, Mo/Be multilayer mirrors were shown to demonstrate a better ratio of reflection efficiency and spectral resolution compared with the commonly used Mo/Si. In the spectral range λ=17-21  nm, a new multilayer structure Al/Si was proposed, which had higher spectral resolution along with comparable reflection efficiency compared with the commonly used Al/Zr multilayer structures. In the spectral range λ=30  nm, the Si/B4C/Mg/Cr multilayer structure turned out to best obey reflection efficiency and long-term stability. The B4C and Cr layers prevented mutual diffusion of the Si and Mg layers. For the spectral range λ=58  nm, a new multilayer Mo/Mg-based structure was developed; its reflection efficiency and long-term stability have been analyzed. We also investigated intrinsic stresses inherent for most of the multilayer structures and proposed possibilities for stress elimination.

Present status of research and development on X-ray microprobe

International Nuclear Information System (INIS)

Koike, Masaki; Suzuki, I.H.

1991-01-01

X-ray beam micro-analysis has advanced rapidly in these years in conjunction with the development of powerful X-ray sources. Among a variety of methods being attempted, the method using a collimated narrow beam has been important because of high brightness, and of usability in both regions of soft and hard X-rays. In the soft X-ray region, the focused beam is formed by a fresnel zone plate or a Schwaltzschild mirror assembly, and can be used for scanning transmission microscope or scanning photoelectron microscope. In the hard X-ray region, the beam is formed by grazing incidence mirrors, and can be used for X-ray fluorescence micro-analysis for obtaining elemental mapping. In this report, the recent progress on the soft X-ray scanning microscopy and the X-ray microprobe has been surveyed, together with the improvement on the related optical elements. (author) 84 refs

Methods for reducing singly reflected rays on the Wolter-I focusing mirrors of the FOXSI rocket experiment

Science.gov (United States)

Buitrago-Casas, Juan Camilo; Elsner, Ronald; Glesener, Lindsay; Christe, Steven; Ramsey, Brian; Courtade, Sasha; Ishikawa, Shin-nosuke; Narukage, Noriyuki; Turin, Paul; Vievering, Juliana; Athiray, P. S.; Musset, Sophie; Krucker, Säm.

2017-08-01

In high energy solar astrophysics, imaging hard X-rays by direct focusing offers higher dynamic range and greater sensitivity compared to past techniques that used indirect imaging. The Focusing Optics X-ray Solar Imager (FOXSI) is a sounding rocket payload that uses seven sets of nested Wolter-I figured mirrors together with seven high-sensitivity semiconductor detectors to observe the Sun in hard X-rays through direct focusing. The FOXSI rocket has successfully flown twice and is funded to fly a third time in summer 2018. The Wolter-I geometry consists of two consecutive mirrors, one paraboloid and one hyperboloid, that reflect photons at grazing angles. Correctly focused X-rays reflect once per mirror segment. For extended sources, like the Sun, off-axis photons at certain incident angles can reflect on only one mirror and still reach the focal plane, generating a background pattern of singly reflected rays (i.e., ghost rays) that can limit the sensitivity of the observation to faint, focused sources. Understanding and mitigating the impact of the singly reflected rays on the FOXSI optical modules will maximize the instruments' sensitivity to background-limited sources. We present an analysis of the FOXSI singly reflected rays based on ray-tracing simulations and laboratory measurements, as well as the effectiveness of different physical strategies to reduce them.

Laser Plasma Soft X-ray Microscope with Wolter Mirrors for Observation of Biological Specimens in Air

Science.gov (United States)

Hoshino, Masato; Aoki, Sadao

2006-02-01

A laser plasma soft X-ray microscope with Wolter mirrors was developed so that specimens could be set in the atmosphere. Silicon nitride membranes 100 nm thick were used as vacuum-tight windows. Using relatively large windows (0.46× 0.46 mm2), an adequate working distance for samples, which was approximately 1.2 mm, was assured. The endurance of the vacuum-tight window was measured briefly. Dry biological cells could be observed with resolution better than 100 nm. A preliminary observation of wet biological cells was carried out using a wet environmental sample holder which was composed of only two sheets of silicon nitride membrane. An X-ray micrograph of wet red blood cells from a chicken was obtained without apparent effects of radiation damage. The properties of a vacuum-tight window and a wet sample holder are discussed.

Adjustable Grazing-Incidence X-Ray Optics

Science.gov (United States)

O'Dell, Stephen L.; Reid, Paul B.

2015-01-01

With its unique subarcsecond imaging performance, NASA's Chandra X-ray Observatory illustrates the importance of fine angular resolution for x-ray astronomy. Indeed, the future of x-ray astronomy relies upon x-ray telescopes with comparable angular resolution but larger aperture areas. Combined with the special requirements of nested grazing-incidence optics, mass, and envelope constraints of space-borne telescopes render such advances technologically and programmatically challenging. The goal of this technology research is to enable the cost-effective fabrication of large-area, lightweight grazing-incidence x-ray optics with subarcsecond resolution. Toward this end, the project is developing active x-ray optics using slumped-glass mirrors with thin-film piezoelectric arrays for correction of intrinsic or mount-induced distortions.

Soft x-ray source by laser produced Xe plasma

International Nuclear Information System (INIS)

Amano, Sho; Masuda, Kazuya; Miyamoto, Shuji; Mochizuki, Takayasu

2010-01-01

The laser plasma soft X-ray source in the wavelength rage of 5-17 nm was developed, which consisted of the rotating drum system supplying cryogenic Xe target and the high repetition rate pulse Nd:YAG slab laser. We found the maximum conversion efficiency of 30% and it demonstrated the soft X-ray generation with the high repetition rate pulse of 320 pps and the high average power of 20 W. The soft X-ray cylindrical mirror was developed and successfully focused the soft X-ray with an energy intensity of 1.3 mJ/cm 2 . We also succeeded in the plasma debris mitigation with Ar gas. This will allow a long lifetime of the mirror and a focusing power intensity of 400 mW/cm 2 with 320 pps. The high power soft X-ray is useful for various applications. (author)

High-resolution x-ray imaging of planar foils irradiated by the Nike KrF laser

International Nuclear Information System (INIS)

Brown, C.; Seely, J.; Feldman, U.; Obenschain, S.; Bodner, S.; Pawley, C.; Gerber, K.; Sethian, J.; Mostovych, A.; Aglitskiy, Y.; Lehecka, T.; Holland, G.

1997-01-01

Thin plastic (CH) foils were irradiated by the Naval Research Laboratory Nike [Obenschain et al., Phys. Plasmas 3, 2098 (1996)] KrF laser and were imaged in the x-ray and extreme ultraviolet regions with two-dimensional spatial resolution in the 3 endash 10 μm range. The CH foils were backlit by a silicon plasma. A spherically curved quartz crystal produced monochromatic images of the Si +12 resonance line radiation with energy 1865 eV that was transmitted by the CH foils. Instabilities that were seeded by linear ripple patterns on the irradiated sides of CH foils were observed. The ripple patterns had periods in the 31 endash 125 μm range and amplitudes in the 0.25 endash 5.0 μm range. The silicon backlighter emission was recorded by an x-ray spectrometer, and the 1865 eV resonance line emission was recorded by a fast x-ray diode. The multilayer mirror telescope recorded images of the C +3 1550 Angstrom emission (energy 8.0 eV) from the backside of the CH foils. copyright 1997 American Institute of Physics

Investigation of the hydrogen multilayered target H/T-D{sub 2} and muonic X-ray yields in ion implantation

Energy Technology Data Exchange (ETDEWEB)

Gheisari, R., E-mail: gheisari@pgu.ac.ir [Physics Department, Persian Gulf University, Bushehr 75169 (Iran, Islamic Republic of)

2011-12-21

This paper extends applications of the multilayered solid target H/T-D{sub 2}, which is kept at 3 K. The time evolutions of muonic tritium atoms ({mu}t) are obtained, by taking into account {mu}t production rate at different places of deuterium material. The apparatus H/T-D{sub 2} can be used for checking nuclear properties of implanted ions, which take part at muon transfer. Electromagnetic X-rays are generated by muon atomic transitions. The muonic X-ray transition energies are strongly affected by the size of nuclei. Here, a solid hydrogen-tritium (H/T) with a Almost-Equal-To 1 mm thick is used for {mu}t production. For ion implantation, the required amount of deuterium material is determined to be about 3.2 {mu}m. Moreover, the muonic X-ray yields are estimated and compared with those of the arrangement H/T-D{sub 2}. While the present target requires argon ion beam intensity nearly a factor of 2 times smaller; gives a relatively higher X-ray yield (15% enhancement per hour) at the energy 644 keV with the detection efficiency of Almost-Equal-To 1%.

Broad-band hard X-ray reflectors

DEFF Research Database (Denmark)

Joensen, K.D.; Gorenstein, P.; Hoghoj, P.

1997-01-01

Interest in optics for hard X-ray broad-band application is growing. In this paper, we compare the hard X-ray (20-100 keV) reflectivity obtained with an energy-dispersive reflectometer, of a standard commercial gold thin-film with that of a 600 bilayer W/Si X-ray supermirror. The reflectivity...... of the multilayer is found to agree extraordinarily well with theory (assuming an interface roughness of 4.5 Angstrom), while the agreement for the gold film is less, The overall performance of the supermirror is superior to that of gold, extending the band of reflection at least a factor of 2.8 beyond...... that of the gold, Various other design options are discussed, and we conclude that continued interest in the X-ray supermirror for broad-band hard X-ray applications is warranted....

Hydrogen absorption in epitaxial W/Nb(001) and polycrystalline Fe/Nb(110) multilayers studied in-situ by X-ray/neutron scattering techniques and X-ray absorption spectroscopy

International Nuclear Information System (INIS)

Klose, F.; Rehm, C.; Fieber-Erdmann, M.; Holub-Krappe, E.; Bleif, H. J.; Sowers, H.; Goyette, R.; Troger, L.; Maletta, H.

1999-01-01

Hydrogen can be absorbed in large quantities by 100 A thin Nb layers embedded in epitaxial W/Nb and polycrystalline Fe/Nb multilayers. The solubility and the hydrogen-induced structural changes of the host lattice are explored in-situ by small-angle neutron/X-ray reflectometry and high-angle diffraction. These measurements reveal for both systems that the relative out-of-plane expansion of the Nb layers is considerably larger than the relative increase of the Nb interplanar spacing indicating two distinctly different mechanisms of hydrogen absorption. In Fe/Nb multilayers, hydrogen expands the Nb interplanar spacing in a continuous way as function of the external pressure. In contrast, the Nb lattice expansion is discontinuous in epitaxial W/Nb multilayers: A jump in the Nb(002) Bragg reflection position occurs at a critical hydrogen pressure of 1 mbar. In-situ EXAFS spectroscopy also exhibits an irreversible expansion of the Nb lattice in the film plane for p H2 > 1 mbar. This can be regarded as a structural phase transition from an exclusively out-of-plane to a three-dimensionally expanded state at low and high hydrogen pressures, respectively

Adaptive grazing incidence optics for the next generation of x-ray observatories

Science.gov (United States)

Lillie, C.; Pearson, D.; Plinta, A.; Metro, B.; Lintz, E.; Shropshire, D.; Danner, R.

2010-09-01

Advances in X-ray astronomy require high spatial resolution and large collecting area. Unfortunately, X-ray telescopes with grazing incidence mirrors require hundreds of concentric mirror pairs to obtain the necessary collecting area, and these mirrors must be thin shells packed tightly together... They must also be light enough to be placed in orbit with existing launch vehicles, and able to be fabricated by the thousands for an affordable cost. The current state of the art in X-ray observatories is represented by NASA's Chandra X-ray observatory with 0.5 arc-second resolution, but only 400 cm2 of collecting area, and by ESA's XMM-Newton observatory with 4,300 cm2 of collecting area but only 15 arc-second resolution. The joint NASA/ESA/JAXA International X-ray Observatory (IXO), with {15,000 cm2 of collecting area and 5 arc-second resolution which is currently in the early study phase, is pushing the limits of passive mirror technology. The Generation-X mission is one of the Advanced Strategic Mission Concepts that NASA is considering for development in the post-2020 period. As currently conceived, Gen-X would be a follow-on to IXO with a collecting area >= 50 m2, a 60-m focal length and 0.1 arc-second spatial resolution. Gen-X would be launched in {2030 with a heavy lift Launch Vehicle to an L2 orbit. Active figure control will be necessary to meet the challenging requirements of the Gen-X optics. In this paper we present our adaptive grazing incidence mirror design and the results from laboratory tests of a prototype mirror.

Performance of transition metal-carbon multilayer mirrors from 80 to 350 eV

International Nuclear Information System (INIS)

Kania, D.R.; Bartlett, R.J.; Trela, W.J.; Spiller, E.; Golub, L.

1984-03-01

We report measurements and theoretical calculations of the reflectivity and resolving power of multilayer mirrors made of alternate layers of a transition metal (Co, Fe, V, and Cr) and carbon (2d approx. = 140 A) from 80 to 350 eV

Nanoscopium: a Scanning Hard X-ray Nanoprobe Beamline at Synchrotron Soleil

Science.gov (United States)

Somogyi, A.; Polack, F.; Moreno, T.

2010-06-01

Nanoscopium is the single scanning hard X-ray nano-probe beamline planned at SOLEIL. This ˜155 m long beamline will fully exploit the high brilliance and coherence characteristics of the X-ray beam both for diffraction limited focusing and for contrast formation. It will offer the most advanced imaging techniques in multimodal mode and will be a research tool for a wide user community working in the fields of earth-, environmental-, and life-sciences. The different μ-μnano-probe techniques offered by the beamline will permit elemental mapping at trace (ppm) levels (scanning XRF), speciation mapping (XANES), phase gradient mapping (scanning differential phase contrast), and density-contrast based imaging of internal structures (coherent diffraction imaging) in the 30 nm to 1 μm spatial resolution range, also in "in situ conditions". Nanoscopium will cover the 5-20 keV energy range. The stability of the nanobeam will be ensured by horizontally reflecting beamline optics (a sagitally and a tangentially pre-focusing mirror, horizontally reflecting monochromators) in front of the overfilled secondary source. Trade-off between high energy resolution (ΔE/E˜10-4) and high flux (1011 ph/s with ΔE/E˜10-2) will be achieved by two interchangeable monochromators (a double crystal and a double multilayer one). KB mirror and FZP lenses will be used as focusing devices. The beamline is in the design and construction phase. It is foreseen to be open for users at the beginning of 2013.

High heat flux x-ray monochromators: What are the limits?

International Nuclear Information System (INIS)

Rogers, C.S.

1997-06-01

First optical elements at third-generation, hard x-ray synchrotrons, such as the Advanced Photon Source (APS), are subjected to immense heat fluxes. The optical elements include crystal monochromators, multilayers and mirrors. This paper presents a mathematical model of the thermal strain of a three-layer (faceplate, heat exchanger, and baseplate), cylindrical optic subjected to narrow beam of uniform heat flux. This model is used to calculate the strain gradient of a liquid-gallium-cooled x-ray monochromator previously tested on an undulator at the Cornell High Energy Synchrotron Source (CHESS). The resulting thermally broadened rocking curves are calculated and compared to experimental data. The calculated rocking curve widths agree to within a few percent of the measured values over the entire current range tested (0 to 60 mA). The thermal strain gradient under the beam footprint varies linearly with the heat flux and the ratio of the thermal expansion coefficient to the thermal conductivity. The strain gradient is insensitive to the heat exchanger properties and the optic geometry. This formulation provides direct insight into the governing parameters, greatly reduces the analysis time, and provides a measure of the ultimate performance of a given monochromator

Hard X-ray emission spectroscopy with pink beam

Energy Technology Data Exchange (ETDEWEB)

Kvashnina, Kristina O.; Rossberg, Andre; Exner, Joerg; Scheinost, Andreas C. [Helmholtz-Zentrum Dresden-Rossendorf e.V., Dresden (Germany). Molecular Structures

2017-06-01

Valence-band X-ray emission spectroscopy (XES) with a ''pink beam'', i.e. a beam with large energy bandwidth produced by a double-multilayer monochromator, is introduced here to overcome the weak count rate of monochromatic beams produced by conventional double-crystal monochromators. Our results demonstrate that - in spite of the large bandwidth in the order of 100 eV - the high spectral resolution of the Johann-type spectrometer is maintained, while the two orders of magnitude higher flux greatly reduces the required counting time. The short working distance Johann-type X-ray emission spectrometer and multilayer monochromator is available at ROBL.

Aging under irradiation of super-mirrors used in neutron guides

International Nuclear Information System (INIS)

N'Guy-Marechal, K.

1997-01-01

The aim of this work is to study the aging of NiC x /Ti super-mirror multilayers used in neutron guides under thermal neutron irradiation. These multilayers allow an increase of the apparent critical angle of total reflection by creating constructive interferences. Neutrons fluxes are thus increased in neutron guides made with a super-mirror coating. Thin films of one and ten bilayers have been deposited on a silicon and a borosilicate glass substrate. We have then studied the evolution of their optical, structural and mechanical properties after irradiation and annealing. After irradiation, a decrease in neutron reflectivity has been observed, due to the interdiffusion of both materials: this phenomenon was particularly important in the coatings deposited on a glass substrate. X-ray diffraction and X-ray absorption spectroscopy have shown that the structural evolutions of both nickel and titanium do not depend on the substrate. Nickel layers remain face-centered cubic after treatment, whereas the initially hexagonal closed-packed titanium becomes face-centered cubic with a texture in the [111] direction. This phase transformation has been attributed to the formation of a TiH compound containing as much as 50 % hydrogen. Despite these structural changes, stress relaxation has occurred after irradiation in our layers. On the contrary, then mean stress that we have determined in previous samples, elaborated in another laboratory, has increased after irradiation. Comparison of both results shows that stress evolution is linked to the deposition conditions. As stress remains almost unchanged after annealing, we may conclude that only irradiation defects, and not heating, lead to stress evolution. Our samples being very similar to real neutron guides, we can extend the results we have obtained in this work to real super-mirrors. (author)

The Imaging X-Ray Polarimetry Explorer (IXPE): Overview

Science.gov (United States)

O'Dell, Steve; Weisskopf, M.; Soffitta, P.; Baldini, L.; Bellazzini, R.; Costa, E.; Elsner, R.; Kaspi, V.; Kolodziejczak, J.; Latronico, L.;

Planetary X-ray studies: past, present and future

Science.gov (United States)

Branduardi-Raymont, Graziella

2016-07-01

Our solar system is a fascinating physics laboratory and X-ray observations are now firmly established as a powerful diagnostic tool of the multiple processes taking place in it. The science that X-rays reveal encompasses solar, space plasma and planetary physics, and the response of bodies in the solar system to the impact of the Sun's activity. This talk will review what we know from past observations and what we expect to learn in the short, medium and long term. Observations with Chandra and XMM-Newton have demonstrated that the origin of Jupiter's bright soft X-ray aurorae lies in the Charge eXchange (CX) process, likely to involve the interaction with atmospheric neutrals of local magnetospheric ions, as well as those carried in the solar wind. At higher energies electron bremsstrahlung is thought to be the X-ray emitting mechanism, while the whole planetary disk acts as a mirror for the solar X-ray flux via Thomson and fluorescent scattering. This 'X-ray mirror' phenomenon is all that is observed from Saturn's disk, which otherwise lacks X-ray auroral features. The Earth's X-ray aurora is bright and variable and mostly due to electron bremsstrahlung and line emission from atmospheric species. Un-magnetised planets, Venus and Mars, do not show X-ray aurorae but display the interesting combination of mirroring the solar X-ray flux and producing X-rays by Solar Wind Charge eXchange (SWCX) in their exospheres. These processes respond to different solar stimulation (photons and solar wind plasma respectively) hence their relative contributions are seen to vary according to the Sun's output. Present and future of planetary X-ray studies are very bright. We are preparing for the arrival of the Juno mission at Jupiter this summer and for coordinated observations with Chandra and XMM-Newton on the approach and later during Juno's orbital phase. These will allow direct correlation of the local plasma conditions with the X-ray emissions and the establishment of the

X-ray emission from plasmas created by smoothed KrF laser irradiation

International Nuclear Information System (INIS)

Aglitskiy, Y.; Lehecka, T.; Deniz, A.; Hardgrove, J.; Seely, J.; Brown, C.; Feldman, U.; Pawley, C.; Gerber, K.; Bodner, S.; Obenschain, S.; Lehmberg, R.; McLean, E.; Pronko, M.; Sethian, J.; Stamper, J.; Schmitt, A.; Sullivan, C.; Holland, G.; Laming, M.

1996-01-01

The x-ray emission from plasmas created by the Naval Research Laboratory Nike KrF laser [Phys. Plasmas 3, 2098 (1996) ] was characterized using imaging and spectroscopic instruments. The laser wavelength was 1/4 μm, and the beams were smoothed by induced spatial incoherence (ISI). The targets were thin foils of CH, aluminum, titanium, and cobalt and were irradiated by laser energies in the range 100 endash 1500 J. A multilayer mirror microscope operating at an energy of 95 eV recorded images of the plasma with a spatial resolution of 2 μm. The variation of the 95 eV emission across the 800 μm focal spot was 1.3% rms. Using a curved crystal imager operating in the 1 endash 2 keV x-ray region, the density, temperature, and opacity of aluminum plasmas were determined with a spatial resolution of 10 μm perpendicular to the target surface. The spectral line ratios indicated that the aluminum plasmas were relatively dense, cool, and optically thick near the target surface. The absolute radiation flux was determined at 95 eV and in x-ray bandpasses covering the 1 endash 8 keV region. The electron temperature inferred from the slope of the x-ray flux versus energy data in the 5 endash 8 keV region was 900 eV for an incident laser energy of 200 J and an intensity of ≅10 13 W/cm 2

Heat stability evaluations of Co/SiO2 multilayers

International Nuclear Information System (INIS)

Ishino, Masahiko; Koike, Masato; Kanehira, Mika; Satou, Futami; Terauchi, Masami; Sano, Kazuo

2008-01-01

The heat stability of Co/SiO 2 multilayers was evaluated. Co/SiO 2 multilayer samples were deposited on Si substrate by means of an ion beam sputtering method, and annealed at temperatures from 100degC to 600degC in a vacuum furnace. For the structural and optical evaluations, small angle x-ray diffraction (XRD) measurements, soft x-ray reflectivity measurements, and transmission electron microscopy (TEM) observations were carried out. As the results, the Co/SiO 2 multilayer samples annealed up to 400degC maintained the initial multilayer structures, and kept almost the same soft x-ray reflectivities as that of the as-deposited Co/SiO 2 multilayer sample. A deterioration of the multilayer structure caused by the growth of Co grains was found on the Co/SiO 2 multilayer samples annealed over 500degC, and the soft x-ray reflectivity dropped in accordance with the deterioration of the multilayer structure. (author)

In situ characterization of delamination and crack growth of a CGO–LSM multi-layer ceramic sample investigated by X-ray tomographic microscopy

DEFF Research Database (Denmark)

Bjørk, Rasmus; Esposito, Vincenzo; Lauridsen, Erik Mejdal

2014-01-01

The densification, delamination and crack growth behavior in a Ce0.9Gd0.1O1.95 (CGO) and (La0.85Sr0.15)0.9MnO3 (LSM) multi-layer ceramic sample was studied using in situ X-ray tomographic microscopy (microtomography) to investigate the critical dynamics of crack propagation and delamination...... in a multilayered sample. Naturally occurring defects, caused by the sample preparation process, are shown not to be critical in sample degradation. Instead defects are nucleated during the debinding step. Crack growth is significantly faster along the material layers than perpendicular to them, and crack growth...

Hard X-ray/soft gamma-ray telescope designs for future astrophysics missions

DEFF Research Database (Denmark)

Ferreira, Desiree Della Monica; Christensen, Finn Erland; Pivovaroff, Michael J.

2013-01-01

We present several concept designs of hard X-ray/soft λ-ray focusing telescopes for future astrophysics missions. The designs are based on depth graded multilayer coatings. These have been successfully employed on the NuSTAR mission for energies up to 80 keV. Recent advances in demonstrating...

Laboratory and In-Flight In-Situ X-ray Imaging and Scattering Facility for Materials, Biotechnology and Life Sciences

Science.gov (United States)

2003-01-01

We propose a multifunctional X-ray facility for the Materials, Biotechnology and Life Sciences Programs to visualize formation and behavior dynamics of materials, biomaterials, and living organisms, tissues and cells. The facility will combine X-ray topography, phase micro-imaging and scattering capabilities with sample units installed on the goniometer. This should allow, for the first time, to monitor under well defined conditions, in situ, in real time: creation of imperfections during growth of semiconductors, metal, dielectric and biomacromolecular crystals and films, high-precision diffraction from crystals within a wide range of temperatures and vapor, melt, solution conditions, internal morphology and changes in living organisms, tissues and cells, diffraction on biominerals, nanotubes and particles, radiation damage, also under controlled formation/life conditions. The system will include an ultrabright X-ray source, X-ray mirror, monochromator, image-recording unit, detectors, and multipurpose diffractometer that fully accommodate and integrate furnaces and samples with other experimental environments. The easily adjustable laboratory and flight versions will allow monitoring processes under terrestrial and microgravity conditions. The flight version can be made available using a microsource combined with multilayer or capillary optics.

The X-ray Astronomy Recovery Mission

Science.gov (United States)

Tashiro, M.; Kelley, R.

2017-10-01

On 25 March 2016, the Japanese 6th X-ray astronomical satellite ASTRO-H (Hitomi), launched on February 17, lost communication after a series of mishap in its attitude control system. In response to the mishap the X-ray astronomy community and JAXA analyzed the direct and root cause of the mishap and investigated possibility of a recovery mission with the international collaborator NASA and ESA. Thanks to great effort of scientists, agencies, and governments, the X-ray Astronomy Recovery Mission (XARM) are proposed. The recovery mission is planned to resume high resolution X-ray spectroscopy with imaging realized by Hitomi under the international collaboration in the shortest time possible, simply by focusing one of the main science goals of Hitomi Resolving astrophysical problems by precise high-resolution X-ray spectroscopy'. XARM will carry a 6 x 6 pixelized X-ray micro-calorimeter on the focal plane of an X-ray mirror assembly, and an aligned X-ray CCD camera covering the same energy band and wider field of view, but no hard X-ray or soft gamma-ray instruments are onboard. In this paper, we introduce the science objectives, mission concept, and schedule of XARM.

X-Ray Optics: Past, Present, and Future

Science.gov (United States)

Zhang, William W.

2010-01-01

X-ray astronomy started with a small collimated proportional counter atop a rocket in the early 1960s. It was immediately recognized that focusing X-ray optics would drastically improve both source location accuracy and source detection sensitivity. In the past 5 decades, X-ray astronomy has made significant strides in achieving better angular resolution, large photon collection area, and better spectral and timing resolutions, culminating in the three currently operating X-ray observatories: Chandra, XMM/Newton, and Suzaku. In this talk I will give a brief history of X-ray optics, concentrating on the characteristics of the optics of these three observatories. Then I will discuss current X-ray mirror technologies being developed in several institutions. I will end with a discussion of the optics for the International X-ray Observatory that I have been developing at Goddard Space Flight Center.

A hybrid concept (segmented plus monolithic fused silica shells) for a high-throughput and high-angular resolution x-ray mission (Lynx/X-Ray Surveyor like)

Science.gov (United States)

Basso, Stefano; Civitani, Marta; Pareschi, Giovanni; Parodi, Giancarlo

2017-09-01

Lynx is a large area and high angular resolution X-ray mission being studied by NASA to be presented to the next Decadal Survey for the implementation in the next decade. It aims to realize an X-ray telescope with the effective area similar to Athena (2 m2 at 1 keV) but with the same angular resolution of Chandra and a much larger Field Of View (up 20 arcmin x 20 arcmin). The science of X-ray Surveyor requires a large-throughput mirror assembly with sub-arcsec angular resolution. These future X-ray mirrors have a set of requirements which, collectively, represents very substantial advances over any currently in operation or planned for missions other than X-ray Surveyor. Of particular importance is achieving low mass per unit collecting area, while maintaining Chandra like angular resolution. Among the possible solutions under study, the direct polishing of both thin monolithic pseudo-cylindrical shells and segments made of fused silica are being considered as viable solutions for the implementation of the mirrors. Fused silica has very good thermomechanical parameters (including a very low CTE), making the material particularly well suited for for the production of the Lynx mirrors. It should be noted that the use of close shells is also very attractive, since the operations for the integration of the shells will be greatly simplified and the area lost due to the vignetting from the interfacing structures minimized even if the management of such big (diameter of 3 m) and thin shells have to be demonstrated. In this paper we will discuss a possible basic layout for a full shell mirror and a hybrid concept (segmented plus monolithic shells made of fused silica) as a second solution, for the Lynx/XRS telescope, discussing preliminary results in terms of optical and mechanical performance.

Characterization of a piezo bendable X-ray mirror.

Science.gov (United States)

Vannoni, Maurizio; Freijo Martín, Idoia; Siewert, Frank; Signorato, Riccardo; Yang, Fan; Sinn, Harald

2016-01-01

A full-scale piezo bendable mirror built as a prototype for an offset mirror at the European XFEL is characterized. The piezo ceramic elements are glued onto the mirror substrate, side-face on with respect to the reflecting surface. Using a nanometre optical component measuring machine and a large-aperture Fizeau interferometer, the mirror profile and influence functions were characterized, and further analysis was made to investigate the junction effect, hysteresis, twisting and reproducibility.

Next Generation Astronomical X-ray Optics: High Angular Resolution, Light Weight, and Low Production Cost

Science.gov (United States)

Zhang. W. W.; Biskach, M. P.; Blake, P. N.; Chan, K. W.; Gaskin, J. A.; Hong, M. L.; Jones, W. D.; Kolos, L. D.; Mazzarella, J. R.; McClelland, R. S.;

Development of contamination-free x-ray optics for next-generation light sources

Energy Technology Data Exchange (ETDEWEB)

Ohashi, Haruhiko, E-mail: hohashi@spring8.or.jp; Senba, Yasunori; Yumoto, Hirokatsu; Koyama, Takahisa; Miura, Takanori; Kishimoto, Hikaru [JASRI / SPring-8, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198 JAPAN (Japan)

2016-07-27

We studied typical forms of contamination on X-ray mirrors that cause degradation of beam quality, investigated techniques to remove the contaminants, and propose methods to eliminate the sources of the contamination. The total amount of carbon-containing substances on various materials in the vicinity of a mirror was measured by thermal desorption-gas chromatography/mass spectrometry and thermal desorption spectroscopy. It was found that cleanliness and ultra-high vacuum techniques are required to produce the contamination-free surfaces that are essential for the propagation of high-quality X-ray beams. The reduction of carbonaceous residue adsorbed on the surfaces, and absorbed into the bulk, of the materials in the vicinity of the mirrors is a key step toward achieving contamination-free X-ray optics.

Behavior under irradiation of super-mirror for neutron guides

International Nuclear Information System (INIS)

N'Guy-Marechal, K.

1997-10-01

The aim of this work is to study the aging of NiCx/Ti super-mirror multilayers used in neutron guides under thermal neutron irradiation. These multilayers allow an increase of the apparent critical angle of total reflection by creating constructive interferences. Neutrons fluxes are thus increased in neutron guides made with a super-mirror coating. Thin films of one and ten bilayers have been deposited on a silicon and a borosilicate glass substrate. We have then studied the evolution of their optical, structural and mechanical properties after irradiation and annealing. After irradiation, a decrease in neutron reflectivity has been observed, due to the interdiffusion of both materials: this phenomenon was particularly important in the coatings deposited on a glass substrate. X-ray diffraction and X-ray absorption spectroscopy have shown that the structural evolutions of both nickel and titanium do not depend on the substrate. Nickel layers remain face-centered cubic after treatment, whereas the initially hexagonal closed-packed titanium becomes face-centered cubic with a texture in the [111] direction. This phase transformation has been attributed to the formation of a TiH compound containing as much as 50% hydrogen. Despite these structural changes, stress relaxation has occurred after irradiation in our layers. On the contrary, the mean stress that we have determined in previous samples, elaborated in another laboratory, has increased after irradiation. Comparison of both results shows that stress evolution is linked to the deposition conditions. As stress remains almost unchanged after annealing, we may conclude that only irradiation defects, and not heating, lead to stress evolution. Our samples being very similar to real neutron guides, we can extend the results we have obtained in this work to real super-mirrors. (author)

Raman and X-ray diffraction study of (Ba,Sr)TiO3/(Bi,Nd)FeO3 multilayer heterostructures

International Nuclear Information System (INIS)

Anokhin, A.S.; Bunina, O.A.; Golovko, Yu I.; Mukhortov, V.M.; Yuzyuk, Yu I.; Simon, P.

2013-01-01

We report synthesis, X-ray diffraction (XRD) and Raman scattering characterisation of epitaxial heterostructures containing alternating (Bi 0.98 Nd 0.02 )FeO 3 (BNFO) and (Ba 0.8 Sr 0.2 TiO 3 ) (BST) layers deposited on (100) MgO substrates. A significant shift of the BST soft mode and partial depolarisation in the Raman spectra of multilayer heterostructures caused by epitaxial strains were observed. Satellite peaks typical for superlattices were observed in the XRD patterns of multilayer heterostructures with layer thicknesses below 30 nm. Raman spectra of the BNFO/BST superlattice with a modulation period of 10 nm revealed hardening of the soft mode and a dominating symmetric-stretching mode at 705 cm −1 due to distortion in FeO 6 octahedra enforced by the epitaxial strain in the superlattice. - Highlights: • BNFO and BST multilayers and superlattices on (100) MgO. • Raman spectra of superlattices exhibit features not observed in bulk BFO. • Satellites in XRD patterns when layer thickness below 30 nm

X-ray diffraction and X-ray standing-wave study of the lead stearate film structure

Energy Technology Data Exchange (ETDEWEB)

Blagov, A. E.; Dyakova, Yu. A.; Kovalchuk, M. V.; Kohn, V. G.; Marchenkova, M. A.; Pisarevskiy, Yu. V.; Prosekov, P. A., E-mail: prosekov@crys.ras.ru [Russian Academy of Sciences, Shubnikov Institute of Crystallography (Russian Federation)

2016-05-15

A new approach to the study of the structural quality of crystals is proposed. It is based on the use of X-ray standing-wave method without measuring secondary processes and considers the multiwave interaction of diffraction reflections corresponding to different harmonics of the same crystallographic reflection. A theory of multiwave X-ray diffraction is developed to calculate the rocking curves in the X-ray diffraction scheme under consideration for a long-period quasi-one-dimensional crystal. This phase-sensitive method is used to study the structure of a multilayer lead stearate film on a silicon substrate. Some specific structural features are revealed for the surface layer of the thin film, which are most likely due to the tilt of the upper layer molecules with respect to the external normal to the film surface.

Ultraviolet magnetic circular dichroism study and x-ray absorption spectroscopy of zinc-blende type CrAs multilayer

International Nuclear Information System (INIS)

Mizuguchi, M.; Manago, T.; Akinaga, H.; Yamada, T.; Yagi-Watanabe, K.; Yuri, M.; Chen, C.T.; Shirai, M.

2004-01-01

Full text: Half-metallic ferromagnets such as CrO 2 and Heusler alloys have attracted a great deal of attention due to its application to spin-dependent device. We have predicted by first principle calculations that zinc-blende (zb) type CrAs, which normally exists in a MnP type, shows a half-metallic band structure, and succeeded in fabrication of this film. However, the epitaxial growth with maintaining a zb structure was limited up to around the nominal thickness of 3 nm. In this contribution, ultraviolet magnetic circular dichroism (MCD) and x-ray absorption spectroscopy (XAS) of CrAs multilayers are reported. These multilayers include zb-CrAs layers and low-temperature GaAs layers stacked alternately, and total thicknesses of zb- CrAs are thicker than 3 nm. Incident beam with the photon energy from 4 to 8 eV were used, and samples were attached on a magnet with the magnetic field of 1.0 T for the MCD measurements. Strong signal with the peak top at 6.5 eV is observed in the MCD spectrum. It can be seen that the experimental spectrum has a good agreement with the theoretical one, which indicates the formation of a superstructure as designed. It was also clarified by the XAS measurement using incident beam from 560 to 600 eV that peak positions of these multilayers shift systematically according to the thickness of each layer. The CrAs/GaAs multilayer is also expected to possess a half-metallic property by the theoretical calculation, therefore, the present result shows the multilayer will be the promising candidate as the spin electronics material

Recent Progress in Adjustable X-ray Optics for Astronomy

Science.gov (United States)

Reid, Paul B.; Allured, Ryan; Cotroneo, Vincenzo; McMuldroch, Stuart; Marquez, Vanessa; Schwartz, Daniel A.; Vikhlinin, Alexey; ODell, Stephen L.; Ramsey, Brian; Trolier-McKinstry, Susan;

An X-ray BBB Michelson interferometer.

Science.gov (United States)

Sutter, John P; Ishikawa, Tetsuya; Kuetgens, Ulrich; Materlik, Gerhard; Nishino, Yoshinori; Rostomyan, Armen; Tamasaku, Kenji; Yabashi, Makina

2004-09-01

A new X-ray Michelson interferometer based on the BBB interferometer of Bonse and Hart and designed for X-rays of wavelength approximately 1 A was described in a previous paper. Here, a further test carried out at the SPring-8 1 km beamline BL29XUL is reported. One of the BBB's mirrors was displaced by a piezo to introduce the required path-length difference. The resulting variation of intensity with piezo voltage as measured by an avalanche photodiode could be ascribed to the phase variation resulting from the path-length change, with a small additional contribution from the change of the position of the lattice planes of the front mirror relative to the rest of the crystal. This 'Michelson fringe' interpretation is supported by the observed steady movement across the output beam of the interference fringes produced by a refractive wedge when the piezo voltage was ramped. The front-mirror displacement required for one complete fringe at the given wavelength is only 0.675 A; therefore, a quiet environment is vital for operating this device, as previous experiments have shown.

Elliptically Bent X-ray Mirrors with Active Temperature Stabilization

International Nuclear Information System (INIS)

Yuan, Sheng; Church, Matthew; Yashchuk, Valeriy V.; Goldberg, Kenneth A.; Celestre, Rich; McKinney, Wayne R.; Kirschman, Jonathan; Morrison, Greg; Noll, Tino; Warwick, Tony; Padmore, Howard A.

2010-01-01

We present details of design of elliptically bent Kirkpatrick-Baez mirrors developed and successfully used at the Advanced Light Source for submicron focusing. A distinctive feature of the mirror design is an active temperature stabilization based on a Peltier element attached directly to the mirror body. The design and materials have been carefully optimized to provide high heat conductance between the mirror body and substrate. We describe the experimental procedures used when assembling and precisely shaping the mirrors, with special attention paid to laboratory testing of the mirror-temperature stabilization. For this purpose, the temperature dependence of the surface slope profile of a specially fabricated test mirror placed inside a temperature-controlled container was measured. We demonstrate that with active mirror-temperature stabilization, a change of the surrounding temperature by more than 3K does not noticeably affect the mirror figure. Without temperature stabilization, the surface slope changes by approximately 1.5 ?mu rad rms (primarily defocus) under the same conditions.

Elliptically Bent X-Ray Mirrors with Active Temperature Stabilization

International Nuclear Information System (INIS)

Yuan, S.; Church, M.; Yashchuk, V.V.; Celestre, R.S.; McKinney, W.R.; Morrison, G.; Warwick, T.; Padmore, H.A.; Goldberg, K.A.; Kirschman, J.; Noll, T.

2010-01-01

We present details of design of elliptically bent Kirkpatrick-Baez mirrors developed and successfully used at the advanced light source for submicron focusing. A distinctive feature of the mirror design is an active temperature stabilization based on a Peltier element attached directly to the mirror body. The design and materials have been carefully optimized to provide high heat conductance between the mirror body and substrate. We describe the experimental procedures used when assembling and precisely shaping the mirrors, with special attention paid to laboratory testing of the mirror-temperature stabilization. For this purpose, the temperature dependence of the surface slope profile of a specially fabricated test mirror placed inside a temperature-controlled container was measured. We demonstrate that with active mirror-temperature stabilization, a change of the surrounding temperature by more than 3 K does not noticeably affect the mirror figure. Without temperature stabilization, the rms slope error is changed by approximately 1.5 μrad (primarily defocus) under the same conditions

Self-assembled iron oxide nanoparticle multilayer: x-ray and polarized neutron reflectivity

International Nuclear Information System (INIS)

Mishra, D; Benitez, M J; Petracic, O; Badini Confalonieri, G A; Szary, P; Brüssing, F; Devishvili, A; Toperverg, B P; Zabel, H; Theis-Bröhl, K; Vorobiev, A; Konovalov, O; Paulus, M; Sternemann, C

2012-01-01

We have investigated the structure and magnetism of self-assembled, 20 nm diameter iron oxide nanoparticles covered by an oleic acid shell for scrutinizing their structural and magnetic correlations. The nanoparticles were spin-coated on an Si substrate as a single monolayer and as a stack of 5 ML forming a multilayer. X-ray scattering (reflectivity and grazing incidence small-angle scattering) confirms high in-plane hexagonal correlation and a good layering property of the nanoparticles. Using polarized neutron reflectivity we have also determined the long range magnetic correlations parallel and perpendicular to the layers in addition to the structural ones. In a field of 5 kOe we determine a magnetization value of about 80% of the saturation value. At remanence the global magnetization is close to zero. However, polarized neutron reflectivity reveals the existence of regions in which magnetic moments of nanoparticles are well aligned, while losing order over longer distances. These findings confirm that in the nanoparticle assembly the magnetic dipole–dipole interaction is rather strong, dominating the collective magnetic properties at room temperature. (paper)

Self-assembled iron oxide nanoparticle multilayer: x-ray and polarized neutron reflectivity.

Science.gov (United States)

Mishra, D; Benitez, M J; Petracic, O; Badini Confalonieri, G A; Szary, P; Brüssing, F; Theis-Bröhl, K; Devishvili, A; Vorobiev, A; Konovalov, O; Paulus, M; Sternemann, C; Toperverg, B P; Zabel, H

2012-02-10

We have investigated the structure and magnetism of self-assembled, 20 nm diameter iron oxide nanoparticles covered by an oleic acid shell for scrutinizing their structural and magnetic correlations. The nanoparticles were spin-coated on an Si substrate as a single monolayer and as a stack of 5 ML forming a multilayer. X-ray scattering (reflectivity and grazing incidence small-angle scattering) confirms high in-plane hexagonal correlation and a good layering property of the nanoparticles. Using polarized neutron reflectivity we have also determined the long range magnetic correlations parallel and perpendicular to the layers in addition to the structural ones. In a field of 5 kOe we determine a magnetization value of about 80% of the saturation value. At remanence the global magnetization is close to zero. However, polarized neutron reflectivity reveals the existence of regions in which magnetic moments of nanoparticles are well aligned, while losing order over longer distances. These findings confirm that in the nanoparticle assembly the magnetic dipole-dipole interaction is rather strong, dominating the collective magnetic properties at room temperature.

The hard x-ray imager onboard IXO

Science.gov (United States)

Nakazawa, Kazuhiro; Takahashi, Tadayuki; Limousin, Olivier; Kokubun, Motohide; Watanabe, Shin; Laurent, Philippe; Arnaud, Monique; Tajima, Hiroyasu

2010-07-01

The Hard X-ray Imager (HXI) is one of the instruments onboard International X-ray Observatory (IXO), to be launched into orbit in 2020s. It covers the energy band of 10-40 keV, providing imaging-spectroscopy with a field of view of 8 x 8 arcmin2. The HXI is attached beneath the Wide Field Imager (WFI) covering 0.1-15 keV. Combined with the super-mirror coating on the mirror assembly, this configuration provides observation of X-ray source in wide energy band (0.1-40.0 keV) simultaneously, which is especially important for varying sources. The HXI sensor part consists of the semiconductor imaging spectrometer, using Si in the medium energy detector and CdTe in the high energy detector as its material, and an active shield covering its back to reduce background in orbit. The HXI technology is based on those of the Japanese-lead new generation X-ray observatory ASTRO-H, and partly from those developed for Simbol-X. Therefore, the technological development is in good progress. In the IXO mission, HXI will provide a major assets to identify the nature of the object by penetrating into thick absorbing materials and determined the inherent spectral shape in the energy band well above the structure around Fe-K lines and edges.

A portable x-ray source and method for radiography

International Nuclear Information System (INIS)

Golovanivsky, K.S.

1996-01-01

A portable x-ray source that produces a sufficient x-ray flux to produce high quality x-ray images on x-ray films. The source includes a vacuum chamber filled with a heavy atomic weight gas at low pressure and an x-ray emitter. The chamber is in a magnetic field and an oscillating electric field and generates electron cyclotron resonance (ECR) plasma having a ring of energetic electrons inside the chamber. The electrons bombard the x-ray emitter which in turn produces x-ray. A pair of magnetic members generate an axisymmetric magnetic mirror trap inside the chamber. The chamber may be nested within a microwave resonant cavity and between the magnets or the chamber and the microwave cavity may be a single composite structure. (author)

Adjustable Grazing Incidence X-ray Optics with 0.5 Arc Second Resolution

Science.gov (United States)

Reid, Paul

We seek to develop adjustable grazing incidence optics for x-ray astronomy. The goal of this development is thin, lightweight mirrors with angular resolution of 0.5 arc seconds, comparable to the Chandra X-ray Observatory. The new mirror design consists of thin segments of a Wolter-I grazing incidence mirror, with piezo-electric material deposited directly on the back surface of the mirror. Depositing a pattern of independently addressable electrodes on top of the piezoelectric material produces an array of independent piezo cells. Energizing a particular cell introduces a localized deformation in the mirror without the need for a reaction structure. By applying the appropriate voltage to the piezo cells, it is possible to correct mirror figure errors that result from mirror fabrication, gravity release, mounting, and thermal effects. Because the thin mirrors segments are lightweight, they can be densely nested to produce collecting area thirty times that of Chandra, on an affordably priced mission. This Supporting Technology program is a follow-on to an existing APRA program. In the existing program we demonstrated the first successful deposition of piezoelectric material on thermally formed glass substrates. We showed that the localized deformations produced by the piezo cells match finite element predictions, and the piezo cell adjustment range meets requirements necessary to achieve the desired figure correction. We have also shown through simulation that representative mirror figure errors can be corrected via modeled influence functions to achieve 0.5 arc sec imaging performance. This provides a firm foundation on which to develop further the technology. We will continue to optimize the deposition of thin piezoelectric films onto thermally formed glass and electroplated metal mirror segments to improve yield and manufacturability. We will deposit piezoelectric material onto conical mirror segments and demonstrate figure correction in agreement with prediction