Interaction between lipid monolayers and poloxamer 188: An X-ray reflectivity and diffraction study

DEFF Research Database (Denmark)

Wu, G.H.; Majewski, J.; Ege, C.

2005-01-01

The mechanism by which poloxamer 188 (P188) seals a damaged cell membrane is examined using the lipid monolayer as a model system. X-ray reflectivity and grazing-incidence x-ray diffraction results show that at low nominal lipid density, P188, by physically occupying the available area and phase ...

Frustrated Total Internal Reflection: A Simple Application and Demonstration.

Science.gov (United States)

Zanella, F. P.; Magalhaes, D. V.; Oliveira, M. M.; Bianchi, R. F.; Misoguti, L.; Mendonca, C. R.

2003-01-01

Describes the total internal reflection process that occurs when the internal angle of incidence is equal to or greater than the critical angle. Presents a demonstration of the effect of frustrated total internal reflection (FTIR). (YDS)

Diffraction efficiency of radially-profiled off-plane reflection gratings

Science.gov (United States)

Miles, Drew M.; Tutt, James H.; DeRoo, Casey T.; Marlowe, Hannah; Peterson, Thomas J.; McEntaffer, Randall L.; Menz, Benedikt; Burwitz, Vadim; Hartner, Gisela; Laubis, Christian; Scholze, Frank

2015-09-01

Future X-ray missions will require gratings with high throughput and high spectral resolution. Blazed off-plane reflection gratings are capable of meeting these demands. A blazed grating profile optimizes grating efficiency, providing higher throughput to one side of zero-order on the arc of diffraction. This paper presents efficiency measurements made in the 0.3 - 1.5 keV energy band at the Physikalisch-Technische Bundesanstalt (PTB) BESSY II facility for three holographically-ruled gratings, two of which are blazed. Each blazed grating was tested in both the Littrow configuration and anti-Littrow configuration in order to test the alignment sensitivity of these gratings with regard to throughput. This paper outlines the procedure of the grating experiment performed at BESSY II and discuss the resulting efficiency measurements across various energies. Experimental results are generally consistent with theory and demonstrate that the blaze does increase throughput to one side of zero-order. However, the total efficiency of the non-blazed, sinusoidal grating is greater than that of the blazed gratings, which suggests that the method of manufacturing these blazed profiles fails to produce facets with the desired level of precision. Finally, evidence of a successful blaze implementation from first diffraction results of prototype blazed gratings produce via a new fabrication technique at the University of Iowa are presented.

New structural studies of liquid crystal by reflectivity and resonant X-ray diffraction; Nouvelles etudes structurales de cristaux liquides par reflectivite et diffraction resonante des rayons X

Energy Technology Data Exchange (ETDEWEB)

Fernandes, P

2007-04-15

This memory presents three structural studies of smectic Liquid Crystals by reflectivity and resonant diffraction of X-rays. It is divided in five chapters. In the first a short introduction to Liquid Crystals is given. In particular, the smectic phases that are the object of this study are presented. The second chapter is consecrated to the X-ray experimental techniques that were used in this work. The three last chapters present the works on which this thesis can be divided. Chapter three demonstrates on free-standing films of MHPOBC (historic liquid crystal that possesses the antiferroelectric sub-phases) the possibility to extend the technique of resonant X-ray diffraction to liquid crystals without resonant element. In the fourth chapter the structure of the B{sub 2} liquid crystal phase of bent-core molecules (or banana molecules) is elucidated by using resonant X-ray diffraction combined with polarization analysis of the diffracted beam. A model of the polarization of the resonant beam diffracted by four different structures proposed for the B{sub 2} phase is developed in this chapter. In the fifth chapter a smectic binary mixture presenting a very original critical point of phase separation is studied by X-ray reflectivity and optical microscopy. A concentration gradient in the direction perpendicular to the plane of the film seems to be induced by the free-standing film geometry. The results of a simplified model of the system are compatible with this interpretation.

Forensic applications of microscopical infrared internal reflection spectroscopy

Science.gov (United States)

Tungol, Mary W.; Bartick, Edward G.; Reffner, John A.

1994-01-01

Applications of microscopical infrared internal reflection spectroscopy in forensic science are discussed. Internal reflection spectra of single fibers, hairs, paint chips, vehicle rubber bumpers, photocopy toners, carbon copies, writing ink on paper, lipstick on tissue, black electrical tape, and other types of forensic evidence have been obtained. The technique is convenient, non-destructive, and may permit smeared materials to be analyzed in situ.

Quadrupole lamp furnace for high temperature (up to 2050 K) synchrotron powder x-ray diffraction studies in air in reflection geometry

International Nuclear Information System (INIS)

Sarin, P.; Yoon, W.; Jurkschat, K.; Zschack, P.; Kriven, W. M.

2006-01-01

A four-lamp thermal image furnace has been developed to conduct high temperature x-ray diffraction in reflection geometry on oxide ceramic powder samples in air at temperatures ≤2050 K using synchrotron radiation. A refractory crucible made of Pt20%Rh alloy was used as a specimen holder. A material with well characterized lattice expansion properties was used as an internal crystallographic thermometer to determine the specimen temperature and displacement. The performance of the apparatus was verified by measurement of the thermal expansion properties of CeO 2 , MgO, and Pt which were found to be within ±3% of the acceptable values. The advantages, limitations, and important considerations of the instrument developed are discussed

Diffraction Efficiency Testing of Sinusoidal and Blazed Off-Plane Reflection Gratings

Science.gov (United States)

Tutt, James H.; McEntaffer, Randall L.; Marlowe, Hannah; Miles, Drew M.; Peterson, Thomas J.; Deroo, Casey T.; Scholze, Frank; Laubis, Christian

2016-09-01

Reflection gratings in the off-plane mount have the potential to enhance the performance of future high resolution soft X-ray spectrometers. Diffraction efficiency can be optimized through the use of blazed grating facets, achieving high-throughput on one side of zero-order. This paper presents the results from a comparison between a grating with a sinusoidally grooved profile and two gratings that have been blazed. The results show that the blaze does increase throughput to one side of zero-order; however, the total throughput of the sinusoidal gratings is greater than the blazed gratings, suggesting the method of manufacturing the blazed gratings does not produce precise facets. The blazed gratings were also tested in their Littrow and anti-Littrow configurations to quantify diffraction efficiency sensitivity to rotations about the grating normal. Only a small difference in the energy at which efficiency is maximized between the Littrow and anti-Littrow configurations is seen with a small shift in peak efficiency towards higher energies in the anti-Littrow case. This is due to a decrease in the effective blaze angle in the anti-Littrow mounting. This is supported by PCGrate-SX V6.1 modeling carried out for each blazed grating which predicts similar response trends in the Littrow and anti-Littrow orientations.

Reflectivity and diffraction of X rays applied to organic thin films

International Nuclear Information System (INIS)

Rieutord, Francois

1987-01-01

This research thesis reports the study of organic thin films by using X-ray-based technologies, and more particularly X-ray reflectivity. After some recalls on X ray diffraction, and on the fabrication of Langmuir-Blodgett films, the author shows how, by combining three X-ray-based techniques, it is possible to study a volume structure of a thin film. He describes the technique of measurement by X- ray reflexivity, its experimental implementation, and methods for result interpretation. In the next part, the author reports the study of peculiar interference effects which are noticed in reflexivity on Langmuir-Blodgett films, and then describes the nature of these films by correlating results of X ray reflexivity with direct observations performed by electronic microscopy on replica [fr

Monitoring non-pseudomorphic epitaxial growth of spinel/perovskite oxide heterostructures by reflection high-energy electron diffraction

Energy Technology Data Exchange (ETDEWEB)

Schütz, P.; Pfaff, F.; Scheiderer, P.; Sing, M.; Claessen, R. [Physikalisches Institut and Röntgen Center for Complex Material Systems (RCCM), Universität Würzburg, Am Hubland, D-97074 Würzburg (Germany)

2015-02-09

Pulsed laser deposition of spinel γ-Al{sub 2}O{sub 3} thin films on bulk perovskite SrTiO{sub 3} is monitored by high-pressure reflection high-energy electron diffraction (RHEED). The heteroepitaxial combination of two materials with different crystal structures is found to be inherently accompanied by a strong intensity modulation of bulk diffraction patterns from inelastically scattered electrons, which impedes the observation of RHEED intensity oscillations. Avoiding such electron surface-wave resonance enhancement by de-tuning the RHEED geometry allows for the separate observation of the surface-diffracted specular RHEED signal and thus the real-time monitoring of sub-unit cell two-dimensional layer-by-layer growth. Since these challenges are essentially rooted in the difference between film and substrate crystal structure, our findings are of relevance for the growth of any heterostructure combining oxides with different crystal symmetry and may thus facilitate the search for novel oxide heterointerfaces.

Experimental observation of acoustic sub-harmonic diffraction by a grating

Energy Technology Data Exchange (ETDEWEB)

Liu, Jingfei, E-mail: benjamin.jf.liu@gatech.edu; Declercq, Nico F., E-mail: declercqdepatin@gatech.edu [Laboratory for Ultrasonic Nondestructive Evaluation “LUNE,” Georgia Tech Lorraine, Georgia Tech-CNRS UMI2958, Georgia Institute of Technology, 2, rue Marconi, Metz 57070 (France)

2014-06-28

A diffraction grating is a spatial filter causing sound waves or optical waves to reflect in directions determined by the frequency of the waves and the period of the grating. The classical grating equation is the governing principle that has successfully described the diffraction phenomena caused by gratings. However, in this work, we show experimental observation of the so-called sub-harmonic diffraction in acoustics that cannot be explained by the classical grating equation. Experiments indicate two physical phenomena causing the effect: internal scattering effects within the corrugation causing a phase shift and nonlinear acoustic effects generating new frequencies. This discovery expands our current understanding of the diffraction phenomenon, and it also makes it possible to better design spatial diffraction spectra, such as a rainbow effect in optics with a more complicated color spectrum than a traditional rainbow. The discovery reveals also a possibly new technique to study nonlinear acoustics by exploitation of the natural spatial filtering effect inherent to an acoustic diffraction grating.

New optical scheme for differential measurements of diffraction reflection intensity on X-radiation sliding incidence

International Nuclear Information System (INIS)

Golovin, A.L.; Mas', E.T.

1989-01-01

An X-ray optical scheme for differential measurements of X-ray diffraction under sliding incidence conditions is proposed and an attachment design realizng this scheme, using standard equipment, is described. The main feature of the scheme is the following: collimation according to the Bragg angle is carried out for the reflected beam rather than the incident one. Goniometers can be used from DRON, TRS, GS-5 and other spectrometers. The goniometer head carrying the sample is standard, it is a part of the DRON, TRS and DTS. The crystal analyzer is fixed on the attachment. The angular position of the crystal monochromator is controlled by an inductive sensor. The experimental differential curves of X-ray diffraction under conditions of sliding incidence, taken for a silicon crystal having the 111 orientation, are given as well

Inner core boundary topography explored with reflected and diffracted P waves

Science.gov (United States)

deSilva, Susini; Cormier, Vernon F.; Zheng, Yingcai

2018-03-01

The existence of topography of the inner core boundary (ICB) can affect the amplitude, phase, and coda of body waves incident on the inner core. By applying pseudospectral and boundary element methods to synthesize compressional waves interacting with the ICB, these effects are predicted and compared with waveform observations in pre-critical, critical, post-critical, and diffraction ranges of the PKiKP wave reflected from the ICB. These data sample overlapping regions of the inner core beneath the circum-Pacific belt and the Eurasian, North American, and Australian continents, but exclude large areas beneath the Pacific and Indian Oceans and the poles. In the pre-critical range, PKiKP waveforms require an upper bound of 2 km at 1-20 km wavelength for any ICB topography. Higher topography sharply reduces PKiKP amplitude and produces time-extended coda not observed in PKiKP waveforms. The existence of topography of this scale smooths over minima and zeros in the pre-critical ICB reflection coefficient predicted from standard earth models. In the range surrounding critical incidence (108-130 °), this upper bound of topography does not strongly affect the amplitude and waveform behavior of PKIKP + PKiKP at 1.5 Hz, which is relatively insensitive to 10-20 km wavelength topography height approaching 5 km. These data, however, have a strong overlap in the regions of the ICB sampled by pre-critical PKiKP that require a 2 km upper bound to topography height. In the diffracted range (>152°), topography as high as 5 km attenuates the peak amplitudes of PKIKP and PKPCdiff by similar amounts, leaving the PKPCdiff/PKIKP amplitude ratio unchanged from that predicted by a smooth ICB. The observed decay of PKPCdiff into the inner core shadow and the PKIKP-PKPCdiff differential travel time are consistent with a flattening of the outer core P velocity gradient near the ICB and iron enrichment at the bottom of the outer core.

RASOR: an advanced instrument for soft x-ray reflectivity and diffraction.

Science.gov (United States)

Beale, T A W; Hase, T P A; Iida, T; Endo, K; Steadman, P; Marshall, A R; Dhesi, S S; van der Laan, G; Hatton, P D

2010-07-01

We report the design and construction of a novel soft x-ray diffractometer installed at Diamond Light Source. The beamline endstation RASOR is constructed for general users and designed primarily for the study of single crystal diffraction and thin film reflectivity. The instrument is comprised of a limited three circle (theta, 2theta, and chi) diffractometer with an additional removable rotation (phi) stage. It is equipped with a liquid helium cryostat, and post-scatter polarization analysis. Motorized motions are provided for the precise positioning of the sample onto the diffractometer center of rotation, and for positioning the center of rotation onto the x-ray beam. The functions of the instrument have been tested at Diamond Light Source, and initial test measurements are provided, demonstrating the potential of the instrument.

Time-dependent Bragg diffraction and short-pulse reflection by one-dimensional photonic crystals

International Nuclear Information System (INIS)

André, Jean-Michel; Jonnard, Philippe

2015-01-01

The time-dependence of the Bragg diffraction by one-dimensional photonic crystals and its influence on the short pulse reflection are studied in the framework of the coupled-wave theory. The indicial response of the photonic crystal is calculated and it appears that it presents a time-delay effect with a transient time conditioned by the extinction length. A numerical simulation is presented for a Bragg mirror in the x-ray domain and a pulse envelope modelled by a sine-squared shape. The potential consequences of the time-delay effect in time-dependent optics of short-pulses are emphasized. (paper)

Diffractive interactions

International Nuclear Information System (INIS)

Del Duca, V.; Marage, P.

1996-08-01

The general framework of diffractive deep inelastic scattering is introduced and reports given in the session on diffractive interactions at the international workshop on deep-inelastic scattering and related phenomena, Rome, April 1996, are presented. (orig.)

Analysis of neutron diffraction peak broadening caused by internal stresses in composite materials

International Nuclear Information System (INIS)

Todd, R.I.; Borsa, C.; Derby, B.

1994-01-01

Neutron diffraction is an essential tool in the study of internal stresses in composite materials. In most work only the peak shifts caused by the related elastic strains are considered, but other valuable information exists in the form of peak shape changes. The conditions under which the pure diffraction profile of the composite (i.e. the profile when all sources of broadening not caused by the residual stresses are removed) represents the probability distribution of the peak shifts corresponding to the strains are examined. It is shown that in these conditions, the pure diffraction profile has no attributes of particle size broadening (and vice versa), thereby providing a test for the validity of results interpreted in this way. The experimental derivation of measured strain distributions in Al 2 O 3 /SiCp composites using neutron diffraction is described. No apparent particle size broadening was detected, demonstrating the validity of the results, which also satisfied other tests for consistency

Nonimaging light concentration using total internal reflection films.

Science.gov (United States)

Ouellette, G; Waltham, C E; Drees, R M; Poon, A; Schubank, R; Whitehead, L A

1992-05-01

We present a method of fabricating nonimaging light concentrators from total internal reflection film. A prototype has been made and tested and found to operate in agreement with predictions of ray-tracing codes. The performance of the prototype is comparable with that of concentrators made from specular reflecting materials.

Mapping residual and internal stress in materials by neutron diffraction

International Nuclear Information System (INIS)

Withers, Ph.J.

2007-01-01

Neutron diffraction provides one of the few means of mapping residual stresses deep within the bulk of materials and components. This article reviews the basic scientific methodology by which internal strains and stresses are inferred from recorded diffraction peaks. Both conventional angular scans and time-of-flight measurements are reviewed and compared. Their complementarity with analogous synchrotron X-ray methods is also highlighted. For measurements to be exploited in structural integrity calculations underpinning the safe operation of engineering components, measurement standards have been defined and the major findings are summarised. Examples are used to highlight the unique capabilities of the method showing how it can provide insights ranging from the basic physics of slip mechanisms in hexagonal polycrystalline materials, through the materials optimisation of stress induced transformations in smart nano-materials, to the industrial introduction of novel friction welding processes exploiting stress residual measurements transferred from prototype sub-scale tests to the joining of full-scale aero-engine assemblies. (author)

Internal Reflection Sensor for the Cone Penetrometer. Innovative Technology Summary Report

International Nuclear Information System (INIS)

None

2001-01-01

The Internal Reflection Sensor, developed by EIC Laboratories, Inc. as a cone penetrometer based technology, provides real-time detection of subsurface non-aqueous phase liquids (NAPLs). The internal reflection element is positioned against the wall of the cone penetrometer probe such that its sensing face is in contact with the soil or groundwater as the cone is pushed into the subsurface. When NAPL is present and in contact with the sensing face, the internally reflected light is diminished. This results in a decrease in the signal output by the detector - a positive indicator of NAPL presence

Trajectory method in the theory of Laue diffraction of X rays in crystals: II. Effect of total reflection at bending deformation

International Nuclear Information System (INIS)

Kohn, V. G.

2008-01-01

The effect of total reflection (switching) of a spherical X-ray wave in the case of Laue diffraction in a crystal with bending deformation is analyzed by the trajectory method. Qualitative analytical description and computation of the spatial structure of the reflected beam for large and small distances between the spherical-wave source and the crystal are performed. The mechanism of much more efficient reflection of an X-ray beam by a deformed crystal in comparison with a perfect crystal is clearly demonstrated. It is also shown that the trajectory method is very convenient for description of the total reflection phenomenon.

Trajectory method in the theory of Laue diffraction of X rays in crystals: II. Effect of total reflection at bending deformation

International Nuclear Information System (INIS)

Kohn, V. G.

2008-01-01

The effect of total reflection (switching) of a spherical X-ray wave in the case of Laue diffraction in a crystal with bending deformation is analyzed by the trajectory method. Qualitative analytical description and computation of the spatial structure of the reflected beam for large and small distances between the spherical-wave source and the crystal are performed. The mechanism of much more efficient reflection of an X-ray beam by a deformed crystal in comparison with a perfect crystal is clearly demonstrated. It is also shown that the trajectory method is very convenient for description of the total reflection phenomenon

Reflection-mode x-ray powder diffraction cell for in situ studies of electrochemical reactions

International Nuclear Information System (INIS)

Roberts, G.A.; Stewart, K.D.

2004-01-01

The design and operation of an electrochemical cell for reflection-mode powder x-ray diffraction experiments are discussed. The cell is designed for the study of electrodes that are used in rechargeable lithium batteries. It is designed for assembly in a glove box so that air-sensitive materials, such as lithium foil electrodes and carbonate-based electrolytes with lithium salts, can be used. The cell uses a beryllium window for x-ray transmission and electrical contact. A simple mechanism for compressing the electrodes is included in the design. Sample results for the cell are shown with a Cu Kα source and a position-sensitive detector

Diffraction and diffusion in room acoustics

DEFF Research Database (Denmark)

Rindel, Jens Holger; Rasmussen, Birgit

1996-01-01

Diffraction and diffusion are two phenomena that are both related to the wave nature of sound. Diffraction due to the finite size of reflecting surfaces and the design of single reflectors and reflector arrays are discussed. Diffusion is the result of scattering of sound reflected from surfaces...... that are not plane but curved or irregular. The importance of diffusion has been demonstrated in concert halls. Methods for the design of diffusing surfaces and the development of new types of diffusers are reviewed. Finally, the importance of diffraction and diffusion in room acoustic computer models is discussed....

X-ray diffraction of multilayers and superlattices

International Nuclear Information System (INIS)

Bartels, W.J.; Hornstra, J.; Lobeek, D.J.W.

1986-01-01

Recursion formulae for calculating the reflected amplitude ratio of multilayers and superlattices have been derived from the Takagi-Taupin differential equations, which describe the dynamical diffraction of X-rays in deformed crystals. Calculated rocking curves of complicated layered structures, such as non-ideal superlattices on perfect crystals, are shown to be in good agreement with observed diffraction profiles. The kinematical theory can save computing time only in the case of an ideal superlattice, for which a geometric series can be used, but the reflections must be below 10% so that multiple reflections can be neglected. For a perfect crystal of arbitrary thickness the absorption at the center of the dynamical reflection is found to be proportional to the square root of the reflectivity. Sputter-deposited periodic multilayers of tungsten and carbon can be considered as an artificial crystal, for which dynamical X-ray diffraction calculations give results very similar to those of a macroscopic optical description in terms of the complex index of refraction and Fresnel reflection coefficients. (orig.)

The effect of a non-hermitian crystal potential on the scattering matrix in reflection electron diffraction

International Nuclear Information System (INIS)

Smith, A.E.; Josefsson, T.W.

1994-01-01

An extension to include general inelastic scattering effects is developed for the case of reflection electron diffraction scattering from surfaces. In this extension of work by Lynch and Moodie, it is shown how the resultant non-Hermitian matrix problem can be recast in a form that is suitable for computation. In particular, a computational method is outlined based on techniques developed by Eberlein for matrix diagonalisation using complex rotations and shears. The resultant methods are applied to the problem of Convergent Beam RHEED. 23 refs., 3 figs

Inverse scattering theory foundations of tomography with diffracting wavefields

International Nuclear Information System (INIS)

Devaney, A.J.

1987-01-01

The underlying mathematical models employed in reflection and transmission computed tomography using diffracting wavefields (called diffraction tomography) are reviewed and shown to have a rigorous basis in inverse scattering theory. In transmission diffraction tomography the underlying wave model is shown to be the Rytov approximation to the complex phase of the wavefield transmitted by the object being probed while in reflection diffraction tomography the underlying wave model is shown to be the Born approximation to the backscattered wavefield from the object. In both cases the goal of the reconstruction process is the determination of the objects's complex index of refraction as a function of position r/sup →/ and, possibly, the frequency ω of the probing wavefield. By use of these approximations the reconstruction problem for both transmission and reflection diffraction tomography can be cast into the simple and elegant form of linearized inverse scattering theory. Linearized inverse scattering theory is shown to lead directly to generalized projection-slice theorems for both reflection and transmission diffraction tomography that provide a simple mathematical relationship between the object's complex index of refraction (the unknown) and the data (the complex phase of the transmitted wave or the complex amplitude of the reflected wave). The conventional projection-slice theorem of X-ray CT is shown to result from the generalized projection-slice theorem for transmission diffraction tomography in the limit of vanishing wavelength (in the absence of wave effects). Fourier based and back-projection type reconstruction algorithms are shown to be directly derivable from the generalized projection-slice theorems

Small-displacement sensing system based on multiple total internal reflections in heterodyne interferometry.

Science.gov (United States)

Wang, Shinn-Fwu; Chiu, Ming-Hung; Chen, Wei-Wu; Kao, Fu-Hsi; Chang, Rong-Seng

2009-05-01

A small-displacement sensing system based on multiple total internal reflections in heterodyne interferometry is proposed. In this paper, a small displacement can be obtained only by measuring the variation in phase difference between s- and p-polarization states for the total internal reflection effect. In order to improve the sensitivity, we increase the number of total internal reflections by using a parallelogram prism. The theoretical resolution of the method is better than 0.417 nm. The method has some merits, e.g., high resolution, high sensitivity, and real-time measurement. Also, its feasibility is demonstrated.

EDS'09: 13th International Conference on Elastic & Diffractive Scattering

CERN Document Server

CERN. Geneva

2009-01-01

The series of International Conferences on Elastic and Diffractive Scattering was founded in 1985 in the picturesque old French town of Blois, famous for its XIV - XVIIth century château, inside of which the first meeting took place. Since then, meetings have been organised every two years in different places of the world: New York (1987), Evanston (1989), Isola d'Elba (1991), Providence (1993), Blois (1995), Seoul (1997), Protvino (1999), Prague (2001), Helsinki (2003), Blois (2005) and Hamburg (2007). The conference will focus on the most recent experimental and theoretical results in particle physics with an emphasis on Quantum Chromodynamics (QCD). http://cern.ch/eds09/ The conference agenda is now full. No further contributions can be accepted.

Total internal reflection second-harmonic generation: probing the alkane water interface

International Nuclear Information System (INIS)

Conboy, J.C.; Daschbach, J.L.; Richmond, G.L.

1994-01-01

Total internal reflection Second-Harmonic Generation (SHG) has been used to study a series of neat n-alkane/water interfaces. Polarization and incident angular-dependent measurements of the SH response show good agreement with theoretical predictions. Analysis of the incident and polarization angular-dependent SH response allows for determination of the nonlinear optical properties of molecules comprising the interfacial region. Based on Kleinman symmetry, the measured surface nonlinear susceptibilities suggest a high degree of interfacial order for octane and decane with less order indicated by the odd carbon n-alkanes examined, heptane and nonane. The SH response in reflection and transmission has been measured under a Total Internal Reflection (TIR) of the fundamental. The measured nonlinear susceptibilities in each case are found to be identical. (orig.)

International Mindedness through the Looking Glass: Reflections on a Concept

Science.gov (United States)

Castro, Paloma; Lundgren, Ulla; Woodin, Jane

2015-01-01

The aim of this article is to report and reflect on a research project involving the conceptualization of the term "International Mindedness", which is used across a range of International Baccalaureate (IB) global and local contexts. The research process involved both a critical analysis of IB official documents and a literature review…

Precise shape reconstruction by active pattern in total-internal-reflection-based tactile sensor.

Science.gov (United States)

Saga, Satoshi; Taira, Ryosuke; Deguchi, Koichiro

2014-03-01

We are developing a total-internal-reflection-based tactile sensor in which the shape is reconstructed using an optical reflection. This sensor consists of silicone rubber, an image pattern, and a camera. It reconstructs the shape of the sensor surface from an image of a pattern reflected at the inner sensor surface by total internal reflection. In this study, we propose precise real-time reconstruction by employing an optimization method. Furthermore, we propose to use active patterns. Deformation of the reflection image causes reconstruction errors. By controlling the image pattern, the sensor reconstructs the surface deformation more precisely. We implement the proposed optimization and active-pattern-based reconstruction methods in a reflection-based tactile sensor, and perform reconstruction experiments using the system. A precise deformation experiment confirms the linearity and precision of the reconstruction.

UV-laser-based longitudinal illuminated diffuser (LID) incorporating diffractive and Lambertian reflectance for the disinfection of beverages

Science.gov (United States)

Lizotte, Todd

2010-08-01

A novel laser beam shaping system was designed to demonstrate the potential of using high power UV laser sources for large scale disinfection of liquids used in the production of food products, such as juices, beer, milk and other beverage types. The design incorporates a patented assembly of optical components including a diffractive beam splitting/shaping element and a faceted pyramidal or conically shaped Lambertian diffuser made from a compression molded PTFE compounds. When properly sintered to an appropriate density, as an example between 1.10 and 1.40 grams per cubic centimeter, the compressed PTFE compounds show a ~99% reflectance at wavelengths ranging from 300 nm to 1500 nm, and a ~98.5% refection of wavelengths from 250 nm to 2000 nm [1]. The unique diffuser configuration also benefits from the fact that the PTFE compounds do not degrade when exposed to ultraviolet radiation as do barium sulfate materials and silver or aluminized mirror coatings [2]. These components are contained within a hermetically sealed quartz tube. Once assembled a laser beam is directed through one end of the tube. This window takes the form of a computer generated diffractive splitter or other diffractive shaper element to split the laser beam into a series of spot beamlets, circular rings or other geometric shapes. As each of the split beamlets or rings cascade downward, they illuminate various points along the tapered PTFE cone or faceted pyramidal form. As they strike the surface they each diffuse in a Lambertian reflectance pattern creating a pseudo-uniform circumferential illuminator along the length of the quartz tube enclosing the assembly. The compact tubular structure termed Longitudinal Illuminated Diffuser (LID) provides a unique UV disinfection source that can be placed within a centrifugal reactor or a pipe based reactor chamber. This paper will review the overall design principle, key component design parameters, preliminary analytic and bench operational testing

International Centre for Diffraction Data (ICDD)

International Nuclear Information System (INIS)

Hubbard, C.R.; O'Connor, B.H.

2002-01-01

Full text: The ICDD is a not-for-profit organisation comprising approximately 300 of the world's leading x-ray scientists. It is dedicated to collecting, editing, publishing and distributing powder diffraction data for the identification of crystalline materials. The membership of the ICDD consists of worldwide representation from academe, government and industry. It is our mission to continue as the world centre for quality x-ray powder diffraction data to meet the needs of the technical community. Through the combined efforts of the members and its staff of 40 at ICDD Headquarters, the organisation serves the x-ray analysis community (i) by producing the ICDD Powder Diffraction File (PDF) and other data base products for materials characterisation; (ii) through x-ray analysis education programs and conference management (including the Denver X-ray Conference); and (iii) through philanthropic initiatives such as scholarship support for postgraduate students working in the field. The current Release 2001 of the PDF (PDF-2) contains 87,500 measured patterns and 49,000 patterns calculated from the ICSD database. The number of PDF patterns in this latest release has increased by approximately 3,000, including some 2,500 measured patterns. The quality of the database is being continuously improved through the organisation's Grant-in-Aid program whereby diffractionists around the world contribute to the measurement of patterns for new materials and to the improvement of existing PDF data. The organisation is devoting much attention to the needs of the bioscience community. The database will soon feature a much-expanded set of patterns for organic, polymer, pharmaceutical and biomaterials. The ICDD is about to release a relational database (RDB) version of the PDF (PDF-4) which will give users a very sophisticated tool for data mining. The PDF-4 will provide a quantum leap in data mining techniques, and will soon lead to the PDF being cross-linked to other diffraction

Grazing incidence diffraction : A review

Energy Technology Data Exchange (ETDEWEB)

Gilles, B [LTPCM, ENSEEG. St. Martin d` Heres. (France)

1996-09-01

Different Grazing Incidence Diffraction (GID) methods for the analysis of thin films and multilayer structures are reviewed in three sections: the reflectivity is developed in the first one, which includes the non-specular diffuse scattering. The second one is devoted to the extremely asymmetric Bragg diffraction and the third one to the in-plane Bragg diffraction. Analytical formulations of the scattered intensities are developed for each geometry, in the framework of the kinetical analysis as well as the dynamical theory. Experimental examples are given to illustrate the quantitative possibility of the GID techniques.

Using X-ray microbeam diffraction to study the long-range internal stresses in aluminum processed by ECAP

International Nuclear Information System (INIS)

Lee, I-Fang; Phan, Thien Q.; Levine, Lyle E.; Tischler, Jonathan Z.; Geantil, Peter T.; Huang, Yi; Langdon, Terence G.; Kassner, Michael E.

2013-01-01

Aluminum alloy 1050 was processed by equal-channel angular pressing (ECAP) using a single pass (equivalent uniaxial strain of about 0.88). Long-range internal stresses (LRISs) were assessed in the grain/subgrain interiors using X-ray microbeam diffraction to measure the spacing of {5 3 1} planes, with normals oriented approximately +27.3°, +4.9° and −17.5° off the pressing (axial) direction. The results are consistent with mechanical analysis that suggests the maximum tensile plastic-strain after one pass is expected for +22.5°, roughly zero along the pressing axis, and maximum compressive strain for the −67.5° direction. The magnitude of the measured maximum compressive long-range internal stress is about 0.13σ a (applied stress) in low-dislocation regions within the grain/subgrain interiors. This work is placed in the context of earlier work where convergent beam electron diffraction was used to analyze LRISs in close proximity to the deformation-induced boundaries. The results are complementary and the measured stresses are consistent with a composite model for long-range internal stresses

Quantitative analysis of minerals by X-ray diffraction

International Nuclear Information System (INIS)

Pietroluongo, L.R.V.; Veiga, M.M. da

1982-01-01

Considerations about the X-ray diffraction technique for quantitative analyses are made; some experiments carried out at CETEM - Centro de Tecnologia Mineral (Rio de Janeiro, Brazil) with synthetic samples and real samples of diatomites (from northeastern region of Brazil) are described. Quartz quantification has been a problem for analytical chemists and is of great importance to the industries which use this raw material. Comments are made about the main factors influencing the intensity of diffracted X-rays, such as: the crystallinity of the mineral phase; the granulometry, the preferential orientation; sample preparation and pressing, the chemical composition of standards and experimental analytical conditions. Several analytical methods used are described: direct measurement of the height or area of a peak resulting from a particular reflection and comparison with a pre-calibrated curve; method of sequential addition of the mineral of interest in the sample and extrapolation of results for ZERO addition; methods of external and internal standards. (C.L.B.) [pt

The internal stress measurement the neutron diffraction bring happiness to your country

Energy Technology Data Exchange (ETDEWEB)

Minakawa, Nobuaki [Japan Atomic Energy Research Inst., Tokai, Ibaraki (Japan). Tokai Research Establishment

2003-03-01

The neutron was discovered by Chadwick in 1932. The first reactor was constructed by the USA in 1942. After that, the research and development of reactors advanced. Numbers of reactors were constructed in Europe and in the US. The researches, which use the neutron, were performed actively and excellent results were obtained in wide fields. The penetrating power of the neutron and the neutron diffraction method began to attract attention for the application to the internal stress measurement, too. In Japan, the neutron diffractometer for the residual stress measurement exclusive was installed in the JRR-3M research reactor of JAERI in 1992, and the research was started. At present, we are using it for the stress measurements of the parts of aircrafts, railways, automobiles, buildings, machines, home electronics products and so on including nuclear reactors. Reliable science must be introduced in order to support safety and long life operation and to supply them at reasonable cost. Among the various scientific probes to find faults in materials, diffraction technique is used to measure the strain distribution in materials by observing the local changes of the distance between crystallographic planes and the stress distribution is computed to improve manufacturing processes. It is only neutron diffraction that can be used to measure the strain inside the materials. Here, I present an overview of the utilization of neutron scattering research for the industrial uses and the history of the neutron scattering research in JAERI briefly. (J.P.N.)

High-order diffraction gratings for high-power semiconductor lasers

International Nuclear Information System (INIS)

Vasil’eva, V. V.; Vinokurov, D. A.; Zolotarev, V. V.; Leshko, A. Yu.; Petrunov, A. N.; Pikhtin, N. A.; Rastegaeva, M. G.; Sokolova, Z. N.; Shashkin, I. S.; Tarasov, I. S.

2012-01-01

A deep diffraction grating with a large period (∼2 μm) within one of the cladding layers is proposed for the implementation of selective feedback in a semiconductor laser. Frequency dependences of reflectance in the 12th diffraction order for rectangular, triangular, and trapezoidal diffraction gratings are calculated. It is shown that the maximum reflectance of the waveguide mode is attained using a rectangular or trapezoidal grating ∼2 μm deep in the laser structure. Deep trapezoidal diffraction gratings with large periods are fabricated in the Al 0.3 Ga 0.7 As cladding layer of a GaAs/AlGaAs laser structure using photolithography and reactive ion etching.

Blazed Grating Resonance Conditions and Diffraction Efficiency Optical Transfer Function

KAUST Repository

Stegenburgs, Edgars

2017-01-08

We introduce a general approach to study diffraction harmonics or resonances and resonance conditions for blazed reflecting gratings providing knowledge of fundamental diffraction pattern and qualitative understanding of predicting parameters for the most efficient diffraction.

Blazed Grating Resonance Conditions and Diffraction Efficiency Optical Transfer Function

KAUST Repository

Stegenburgs, Edgars; Alias, Mohd Sharizal B.; Ng, Tien Khee; Ooi, Boon S.

2017-01-01

We introduce a general approach to study diffraction harmonics or resonances and resonance conditions for blazed reflecting gratings providing knowledge of fundamental diffraction pattern and qualitative understanding of predicting parameters for the most efficient diffraction.

System and technique for characterizing fluids using ultrasonic diffraction grating spectroscopy

Science.gov (United States)

Greenwood, Margaret S [Richland, WA

2008-07-08

A system for determining property of multiphase fluids based on ultrasonic diffraction grating spectroscopy includes a diffraction grating on a solid in contact with the fluid. An interrogation device delivers ultrasound through the solid and a captures a reflection spectrum from the diffraction grating. The reflection spectrum exhibits peaks whose relative size depends on the properties of the various phases of the multiphase fluid. For example, for particles in a liquid, the peaks exhibit dependence on the particle size and the particle volume fraction. Where the exact relationship is know know a priori, data from different peaks of the same reflection spectrum or data from the peaks of different spectra obtained from different diffraction gratings can be used to resolve the size and volume fraction.

High-energy electron diffraction and microscopy

CERN Document Server

Peng, L M; Whelan, M J

2011-01-01

This book provides a comprehensive introduction to high energy electron diffraction and elastic and inelastic scattering of high energy electrons, with particular emphasis on applications to modern electron microscopy. Starting from a survey of fundamental phenomena, the authors introduce the most important concepts underlying modern understanding of high energy electron diffraction. Dynamical diffraction in transmission (THEED) and reflection (RHEED) geometries is treated using ageneral matrix theory, where computer programs and worked examples are provided to illustrate the concepts and to f

An Arduino-Based Experiment Designed to Clarify the Transition to Total Internal Reflection

Science.gov (United States)

Atkin, Keith

2018-01-01

The topic of refraction and reflection of light at the boundary of transparent media is a fundamentally important one. The special case of total internal reflection is however commonly misrepresented in elementary textbooks. This paper addresses the problem and describes an experimental procedure for measuring and displaying reflected and…

Glancing angle synchrotron X-ray diffraction

Energy Technology Data Exchange (ETDEWEB)

Cernik, R J [Daresbury Lab., Warrington, WA (United States)

1996-09-01

This paper describes in basic detail some of the techniques that can be used to study thin films and surfaces. These are all in the X-ray region and cover reflectivity, diffraction form polycrystalline films, textured films and single crystal films. Other effects such as fluorescence and diffuse scattering are mentioned but not discussed in detail. Two examples of the reflectivity from multilayers and the diffraction from iron oxide films are discussed. The advantages of the synchrotron for these studies is stressed and the experimental geometries that can be employed are described i detail. A brief bibliography is provided at the end to accompany this part of the 1996 Frascati school.

Glancing angle synchrotron X-ray diffraction

International Nuclear Information System (INIS)

Cernik, R.J.

1996-01-01

This paper describes in basic detail some of the techniques that can be used to study thin films and surfaces. These are all in the X-ray region and cover reflectivity, diffraction form polycrystalline films, textured films and single crystal films. Other effects such as fluorescence and diffuse scattering are mentioned but not discussed in detail. Two examples of the reflectivity from multilayers and the diffraction from iron oxide films are discussed. The advantages of the synchrotron for these studies is stressed and the experimental geometries that can be employed are described i detail. A brief bibliography is provided at the end to accompany this part of the 1996 Frascati school

Attenuated total internal reflection infrared microspectroscopic imaging using a large-radius germanium internal reflection element and a linear array detector.

Science.gov (United States)

Patterson, Brian M; Havrilla, George J

2006-11-01

The number of techniques and instruments available for Fourier transform infrared (FT-IR) microspectroscopic imaging has grown significantly over the past few years. Attenuated total internal reflectance (ATR) FT-IR microspectroscopy reduces sample preparation time and has simplified the analysis of many difficult samples. FT-IR imaging has become a powerful analytical tool using either a focal plane array or a linear array detector, especially when coupled with a chemometric analysis package. The field of view of the ATR-IR microspectroscopic imaging area can be greatly increased from 300 x 300 microm to 2500 x 2500 microm using a larger internal reflection element of 12.5 mm radius instead of the typical 1.5 mm radius. This gives an area increase of 70x before aberrant effects become too great. Parameters evaluated include the change in penetration depth as a function of beam displacement, measurements of the active area, magnification factor, and change in spatial resolution over the imaging area. Drawbacks such as large file size will also be discussed. This technique has been successfully applied to the FT-IR imaging of polydimethylsiloxane foam cross-sections, latent human fingerprints, and a model inorganic mixture, which demonstrates the usefulness of the method for pharmaceuticals.

Effect of the refraction factor of a plastic fiber shell on the internal reflection coefficient

International Nuclear Information System (INIS)

Pkrksypkin, A.I.; Ponomarev, L.I.

1992-01-01

Results of pilot studies of the effect of refraction factor of plastic fiber shell on the coefficient of light internal reflection in the fiber are presented. It is pointed, that the shell does not absorb the light, but effects the surface layer of the fiber centre so, that dependence of the coefficient of internal reflection on refraction factor of the shell may be described using Fresnel formulae. It is shown, that coefficient of internal reflection decreases with the increase of refraction factor. Technique to determine volume length of scintillation light absorption in the fiber is suggested

Diffraction of polarized light on periodic structures

International Nuclear Information System (INIS)

Bukanina, V; Divakov, D; Tyutyunnik, A; Hohlov, A

2012-01-01

Periodic structures as photonic crystals are widely used in modern laser devices, communication technologies and for creating various beam splitters and filters. Diffraction gratings are applied for creating 3D television sets, DVD and Blu-ray drives and reflective structures (Berkley mirror). It is important to simulate diffraction on such structures to design optical systems with predetermined properties based on photonic crystals and diffraction gratings. Methods of simulating diffraction on periodic structures uses theory of Floquet-Bloch and rigorous coupled-wave analysis (RCWA). Current work is dedicated to analysis of photonic band gaps and simulating diffraction on one-dimensional binary diffraction grating using RCWA. The Maxwell's equations for isotropic media and constitutive relations based on the cgs system were used as a model.

Time-dependent Bragg diffraction by multilayer gratings

International Nuclear Information System (INIS)

André, Jean-Michel; Jonnard, Philippe

2016-01-01

Time-dependent Bragg diffraction by multilayer gratings working by reflection or by transmission is investigated. The study is performed by generalizing the time-dependent coupled-wave theory previously developed for one-dimensional photonic crystals (André J-M and Jonnard P 2015 J. Opt. 17 085609) and also by extending the Takagi–Taupin approach of the dynamical theory of diffraction. The indicial response is calculated. It presents a time delay with a transient time that is a function of the extinction length for reflection geometry and of the extinction length combined with the thickness of the grating for transmission geometry. (paper)

The internal stress measurement the neutron diffraction will bring happiness to your country

International Nuclear Information System (INIS)

Minakawa, Nobuaki

2003-01-01

The neutron was discovered by Chadwick in 1932. The first reactor was constructed by the USA in 1942. After that, the research and development of reactors advanced. Numbers of reactors were constructed in Europe and in the US. The researches, which use the neutron, were performed actively and excellent results were obtained in wide fields. The penetrating power of the neutron and the neutron diffraction method began to attract attention for the application to the internal stress measurement, too. In Japan, the neutron diffractometer for the residual stress measurement exclusive was installed in the JRR-3M research reactor of JAERI in 1992, and the research was started. At present, we are using it for the stress measurements of the parts of air crafts, railways, automobiles, buildings, machines, home electronics products and so on including nuclear reactors. Reliable science must be introduced in order to support safety and long life operation and to supply them at reasonable cost. Among the various scientific probes to find faults in materials, diffraction technique is used to measure the strain distribution in materials by observing the local changes of the distance between crystallographic planes and the stress distribution is computed to improve manufacturing processes. It is only neutron diffraction that can be used to measure the strain inside the materials. Here, I present an overview of the utilization of neutron scattering research for the industrial uses and the history of the neutron scattering research in JAERI briefly. (J.P.N.)

Observation of multiple Bragg reflections of neutrons in bent perfect crystals

Czech Academy of Sciences Publication Activity Database

Mikula, Pavol; Vrána, Miroslav; Šaroun, Jan; Seong, B. S.; Moon, MK.

2011-01-01

Roč. 634, č. 1 (2011), S108-S111 ISSN 0168-9002. [International Workshop on Neutron Optics. Grenoble, 17.03.2010-19.03.2010] R&D Projects: GA ČR GAP204/10/0654 Institutional research plan: CEZ:AV0Z10480505 Keywords : Neutron diffraction * Bent perfect crystal * Multiple reflections Subject RIV: BM - Solid Matter Physics ; Magnetism Impact factor: 1.207, year: 2011

Diffractive Optics for Gravitational Wave Detectors

International Nuclear Information System (INIS)

Bunkowski, A; Burmeister, O; Clausnitzer, T; Kley, E-B; Tuennermann, A; Danzmann, K; Schnabel, R

2006-01-01

All-reflective interferometry based on nano-structured diffraction gratings offers new possibilities for gravitational wave detection. We investigate an all-reflective Fabry-Perot interferometer concept in 2nd order Littrow mount. The input-output relations for such a resonator are derived treating the grating coupler by means of a scattering matrix formalism. A low loss dielectric reflection grating has been designed and manufactured to test the properties of such a grating cavity

X-Ray Diffraction and Reflectivity Validation of the Depletion Attraction in the Competitive Adsorption of Lung Surfactant and Albumin

DEFF Research Database (Denmark)

Stenger, Patric C.; Wu, Guohui; Miller, Chad E.

2009-01-01

as on a pristine interface, but with a more compact lattice corresponding to a small increase in the surface pressure. These results confirm that albumin adsorption creates a physical barrier that inhibits LS adsorption, and that PEG in the subphase generates a depletion attraction between the LS aggregates...... to subsequent LS adsorption that can be overcome by the depletion attraction induced by polyethylene glycol (PEG) in solution. A combination of grazing incidence x-ray diffraction (GIXD), x-ray reflectivity (XR), and pressure-area isotherms provides molecular-resolution information on the location...

Internal reflection spectroscopic analysis of sulphide mineral surfaces

International Nuclear Information System (INIS)

Kaoma, J.

1989-01-01

To establish the reason for flotation of sulfide minerals in the absence of any conventional collector, internal reflection spectroscopic analysis (IRS) of their surfaces was conducted. sulfur, sulfates, thiosulfates, and hydrocarbonates have been detected on the surface of as-grand sulfide minerals. On sodium sulfide-treated surfaces, both sulfur and polysulfide have also been found to be present. From these findings, the flotation of sulfide minerals without collectors is discussed. (author). 26 refs

Dedicated software for diffractive optics design and simulation

International Nuclear Information System (INIS)

Firsov, A; Brzhezinskaya, M; Erko, A; Firsov, A; Svintsov, A

2013-01-01

An efficient software package for the structure design and simulation of imaging properties of diffraction optical elements has been developed. It operates with point source and consists of: the ZON software, to calculate the structure of an optical element in transmission and reflection; the KRGF software, to simulate the diffraction properties of an ideal optical element with point source; the DS software, to calculate the diffraction properties by taking into consideration material and shadowing effects. Optional software allows simulation with a real non-point source. Zone plate thickness profile, source shape as well as substrate curvature are considered in this calculation. This is especially important for the diffractive focusing elements and gratings at a total external reflection, given that the lateral size of the structure can be up to 1 m. The program package can be used in combination with the Nanomaker software to prepare data for ion and e-beam surface modifications and corrections.

Peculiarities of section topograms for the multiple diffraction of X rays

Energy Technology Data Exchange (ETDEWEB)

Kohn, V. G., E-mail: kohnvict@yandex.ru [National Research Centre “Kurchatov Institute” (Russian Federation); Smirnova, I. A. [Russian Academy of Sciences, Institute of Solid State Physics (Russian Federation)

2016-07-15

The distortion of interference fringes on the section topograms of single crystal due to the multiple diffraction of X rays has been investigated. The cases of the 220 and 400 reflections in a silicon crystal in the form of a plate with a surface oriented normally to the [001] direction are considered both theoretically and experimentally. The same section topogram exhibits five cases of multiple diffraction at small azimuthal angles for the 400 reflection and MoK{sub α} radiation, while the topogram for the 220 reflection demonstrates two cases of multiple diffraction. All these cases correspond to different combinations of reciprocal lattice vectors. Exact theoretical calculations of section topograms for the aforementioned cases of multiple diffraction have been performed for the first time. The section topograms exhibit two different distortion regions. The distortions in the central region of the structure are fairly complex and depend strongly on the azimuthal angle. In the tails of the multiple diffraction region, there is a shift of two-beam interference fringes, which can be observed even with a laboratory X-ray source.

Dynamical diffraction in periodic multilayers

CERN Document Server

Sears, V F

1997-01-01

Exact reflectivity curves are calculated numerically for various periodic multilayers using the optical matrix method in order to test the dynamical theory of diffraction. The theory is generally valid for values of the bilayer thickness d up to about 100 A. For somewhat larger values of d, where the theory begins to break down, the initial discrepancy is in the phase of the oscillations in the wings of the peaks. For very large values of d, where the first-order Bragg peak approaches the edge of the mirror reflection, two general types of multilayers can be distinguished. In the first (typified in the present work by Ni/Ti), there is a large (30% or more) reduction in the actual value of the critical wave vector for total reflection while, in the second (typified here by Fe/Ge), there is very little reduction (3 % or so). The origin of these two very different types of behavior is explained. It is also shown that, within the dynamical theory of diffraction, the change in the position of the center of the Dar...

Total internal reflection tomography of small objects

International Nuclear Information System (INIS)

Chen Xudong

2008-01-01

The multiple signal classification (MUSIC) imaging method is applied to determine the locations of a collection of small anisotropic spherical scatterers in the framework of the total internal reflection tomography. Multiple scattering between scatterers is considered and the inverse scattering problem is nonlinear, which, however, is solved by the proposed fast analytical approach where no associated forward problem is iteratively evaluated. The paper also discusses the role of the polarization of incidence waves, the incidence angle, the separation of scatterers from the surface of the substrate, and the level of noise on the resolution of imaging.

Interphase microstress measurements in IN 718 by cold neutron diffraction

Energy Technology Data Exchange (ETDEWEB)

Repper, J.; Link, P.; Hofmann, M.; Petry, W. [TU Muenchen, Forschungsneutronenquelle Heinz Maier-Leibnitz (FRM II), Garching (Germany); Krempaszky, C. [TU Muenchen, Christian-Doppler-Labor fuer Werkstoffmechanik von Hochleistungslegierungen, Garching (Germany); Werner, E. [TU Muenchen, Lehrstuhl fuer Werkstoffkunde und Werkstoffmechanik, Garching (Germany)

2010-06-15

Thermal neutron diffraction is an important and reliable method for the investigation of microscopic stresses. The measurement of Bragg reflections caused by phases of small volume fractions, however, is often intricate due to low intensities and overlapping peaks. The wavelength range of cold neutrons allows to shift the Bragg reflections to larger scattering angles resulting in an increase of relative distances between Bragg reflections. The high resolution of cold neutron diffraction technique is demonstrated by in-situ load tests in which selected Bragg reflections caused by precipitates with small volume fractions in the precipitation strengthened alloy IN 718 are observed. The accumulated microstrains show marked differences in dependence of the precipitated phases within the matrix phase. (orig.)

Neutron diffraction study of internal stresses in brazed CFC/Mo divertor structures for NET/ITER

Energy Technology Data Exchange (ETDEWEB)

Ceretti, M [Laboratoire Leon-Brillouin, CEA/CE Saclay, F-91191, Gif-sur-Yvette (France); Coppola, R [ENEA/Casaccia, INN-FIS, C.P. 2400, I-00100 Rome (Italy); Di Pietro, E [ENEA/Frascati, Dip. FUS, C.P. 2400, I-00100 Rome (Italy); Lodini, A [Laboratoire Leon-Brillouin, CEA/CE Saclay, F-91191, Gif-sur-Yvette (France) Universite de Champagne-Ardennes, Reims (France); Perrin, M [Laboratoire Leon-Brillouin, CEA/CE Saclay, F-91191, Gif-sur-Yvette (France); Piant, A [Laboratoire Leon-Brillouin, CEA/CE Saclay, F-91191, Gif-sur-Yvette (France); Rustichelli, F [Istituto di Scienze Fisiche, Universita di Ancona (Italy)

1994-09-01

This contribution presents the first results of a study, performed by neutron diffraction, on the internal stresses remaining after brazing at 860 C in graphite/molybdenum samples developed for NET/ITER. Samples of polycrystalline graphite and a carbon-fiber composite are considered. The deformation field is characterized close to the brazing interface, within a linear spatial resolution of approximately 2 mm. The results are discussed with reference to those obtainable by other methods and to theoretical considerations. ((orig.))

Design and implementation of an optimal laser pulse front tilting scheme for ultrafast electron diffraction in reflection geometry with high temporal resolution

Directory of Open Access Journals (Sweden)

Francesco Pennacchio

2017-07-01

Full Text Available Ultrafast electron diffraction is a powerful technique to investigate out-of-equilibrium atomic dynamics in solids with high temporal resolution. When diffraction is performed in reflection geometry, the main limitation is the mismatch in group velocity between the overlapping pump light and the electron probe pulses, which affects the overall temporal resolution of the experiment. A solution already available in the literature involved pulse front tilt of the pump beam at the sample, providing a sub-picosecond time resolution. However, in the reported optical scheme, the tilted pulse is characterized by a temporal chirp of about 1 ps at 1 mm away from the centre of the beam, which limits the investigation of surface dynamics in large crystals. In this paper, we propose an optimal tilting scheme designed for a radio-frequency-compressed ultrafast electron diffraction setup working in reflection geometry with 30 keV electron pulses containing up to 105 electrons/pulse. To characterize our scheme, we performed optical cross-correlation measurements, obtaining an average temporal width of the tilted pulse lower than 250 fs. The calibration of the electron-laser temporal overlap was obtained by monitoring the spatial profile of the electron beam when interacting with the plasma optically induced at the apex of a copper needle (plasma lensing effect. Finally, we report the first time-resolved results obtained on graphite, where the electron-phonon coupling dynamics is observed, showing an overall temporal resolution in the sub-500 fs regime. The successful implementation of this configuration opens the way to directly probe structural dynamics of low-dimensional systems in the sub-picosecond regime, with pulsed electrons.

An International Experience for Social Work Students: Self-Reflection through Poetry and Journal Writing Exercises

Science.gov (United States)

Furman, Rich; Coyne, Ann; Negi, Nalini Junko

2008-01-01

This descriptive article explores the uses of poetry and journaling exercises as means of helping students develop their self-reflective capacities within the context of international social work. First, self-reflection and its importance to social work practice and education is discussed. Second, the importance of self-reflection in international…

Live Imaging of Cellular Internalization of Single Colloidal Particle by Combined Label-Free and Fluorescence Total Internal Reflection Microscopy.

Science.gov (United States)

Byrne, Gerard D; Vllasaliu, Driton; Falcone, Franco H; Somekh, Michael G; Stolnik, Snjezana

2015-11-02

In this work we utilize the combination of label-free total internal reflection microscopy and total internal reflectance fluorescence (TIRM/TIRF) microscopy to achieve a simultaneous, live imaging of single, label-free colloidal particle endocytosis by individual cells. The TIRM arm of the microscope enables label free imaging of the colloid and cell membrane features, while the TIRF arm images the dynamics of fluorescent-labeled clathrin (protein involved in endocytosis via clathrin pathway), expressed in transfected 3T3 fibroblasts cells. Using a model polymeric colloid and cells with a fluorescently tagged clathrin endocytosis pathway, we demonstrate that wide field TIRM/TIRF coimaging enables live visualization of the process of colloidal particle interaction with the labeled cell structure, which is valuable for discerning the membrane events and route of colloid internalization by the cell. We further show that 500 nm in diameter model polystyrene colloid associates with clathrin, prior to and during its cellular internalization. This association is not apparent with larger, 1 μm in diameter colloids, indicating an upper particle size limit for clathrin-mediated endocytosis.

Three-dimensional Bragg diffraction in growth-disordered opals

Science.gov (United States)

Baryshev, A. V.; Kaplyanskii, Alexander A.; Kosobukin, Vladimir A.; Limonov, M. F.; Samusev, K. B.; Usvyat, D. E.

2003-06-01

After artificial opals as well as opal-based infilled and inverted composites are considered to be promising representatives of photonic crystal materials. Earlier, photonic stop gaps in opals were studied mainly in transmission or specular reflection geometries corresponding to "one-dimensional" Bragg diffraction. On the contrary, this work was aimed at observing the typical patterns of optical Bragg diffraction in which phenomenon opal crystal structure acts as a three-dimensional diffraction grating. Although our experiments were performed for artificial opals possessing unavoidable imperfections a well-pronounced diffraction peaks were observed characteristic of a crystal structure. Each of the diffraction maxima reveals a photonic stop gap in the specified direction, while the spectral width of the peak is a measure of the photonic stop gap width.

Generalized diffraction-stack migration and filtering of coherent noise

KAUST Repository

Zhan, Ge

2014-01-27

We reformulate the equation of reverse-time migration so that it can be interpreted as summing data along a series of hyperbola-like curves, each one representing a different type of event such as a reflection or multiple. This is a generalization of the familiar diffraction-stack migration algorithm where the migration image at a point is computed by the sum of trace amplitudes along an appropriate hyperbola-like curve. Instead of summing along the curve associated with the primary reflection, the sum is over all scattering events and so this method is named generalized diffraction-stack migration. This formulation leads to filters that can be applied to the generalized diffraction-stack migration operator to mitigate coherent migration artefacts due to, e.g., crosstalk and aliasing. Results with both synthetic and field data show that generalized diffraction-stack migration images have fewer artefacts than those computed by the standard reverse-time migration algorithm. The main drawback is that generalized diffraction-stack migration is much more memory intensive and I/O limited than the standard reverse-time migration method. © 2014 European Association of Geoscientists & Engineers.

Diffractive optical element-based glossmeter for the on-line measurement of normal reflectance on a printed porous coated paper

Science.gov (United States)

Oksman, Antti; Kuivalainen, Kalle; Ta˚G, Carl-Mikael; Juuti, Mikko; Mattila, Rauno; Hietala, Eero; Gane, Patrick A. C.; Peiponen, Kai-Erik

2011-04-01

Gloss of a product, such as print gloss, is mainly inspected with conventional white light glossmeters both at laboratory or production facilities. However, problems occur in conventional gloss measurement when the inspected surface is vertically moved in the plane of incidence and reflection or when the measurement area is small or curved. For a partial solution to these problems, we have previously introduced diffractive optical element-based glossmeters (DOGs) for the gloss inspection in laboratories and off-line use. We present a new construction of DOG, termed μDOG 1D, for the one-dimensional on-line print gloss measurement, in the form of the reflectance determination normal to the surface. The function of the glossmeter is demonstrated by laboratory tests and on-line measurements at a heat-set web offset printing machine. It is shown that gloss (i.e., normal reflectance) and minute gloss variation of papers and prints can be measured at the printing line using the glossmeter. This glossmeter is expected to be useful in real-time monitoring of the gloss and surface-specific absorption not only in the printing industry but also in inspection of products in other industrial sectors, such as metal finishing, laminating, paper, and construction materials manufacturing.

Internal-wave reflection from uniform slopes: higher harmonics and Coriolis effects

Directory of Open Access Journals (Sweden)

T. Gerkema

2006-01-01

Full Text Available Weakly nonlinear reflection of internal waves from uniform slopes produces higher harmonics and mean fields; the expressions are here derived for constant stratification and with Coriolis effects fully included, i.e. the horizontal component of the earth rotation vector (referred to as 'non-traditional'' is taken into account. Uniformity in one of the horizontal directions is assumed. It is shown that solutions can be as readily derived with as without ; hence there is no need to make the so-called Traditional Approximation. Examples of reflecting internal-wave beams are presented for super-inertial, inertial and sub-inertial frequencies. The problem of resonant and non-resonant forcing of the second harmonic is studied for single plane waves; unlike under the Traditional Approximation, the problem of reflection from a horizontal bottom no longer forms a singular case. Non-traditional effects are favourable to resonant forcing at near-tidal rather than near-inertial frequencies, and generally increase the intensity of the second harmonic. Strong stratification tends to suppress non-traditional effects, but a near-total suppression is only attained for high values of stratification that are characteristic of the seasonal thermocline; in most parts of the ocean, non-traditional effects can therefore be expected to be important.

Visible diffraction from quasi-crystalline arrays of carbon nanotubes

Science.gov (United States)

Butler, Timothy P.; Butt, Haider; Wilkinson, Timothy D.; Amaratunga, Gehan A. J.

2015-08-01

Large area arrays of vertically-aligned carbon nanotubes (VACNTs) are patterned in a quasi-crystalline Penrose tile arrangement through electron beam lithography definition of Ni catalyst dots and subsequent nanotube growth by plasma-enhanced chemical vapour deposition. When illuminated with a 532 nm laser beam high-quality and remarkable diffraction patterns are seen. The diffraction is well matched to theoretical calculations which assume apertures to be present at the location of the VACNTs for transmitted light. The results show that VACNTs act as diffractive elements in reflection and can be used as spatially phased arrays for producing tailored diffraction patterns.

Multiple x-ray diffraction simulation and applications

International Nuclear Information System (INIS)

Costa, C.A.B.S. da.

1989-09-01

A computer program (MULTX) was implemented for simulation X-ray multiple diffraction diagrams in Renninger geometries. The program uses the X-ray multiple diffraction theory for imperfect crystals. The iterative calculation of the intensities is based on the Taylor series general term, and the primary beam power expansion is given as function of the beam x penetration in the crystal surface. This development allows to consider the simultaneous interaction of the beams involved in the multiple diffraction phenomenon. The simulated diagrams are calculated point-to-point and the tests for the Si and GaAs presented good reproduction of the experimental diagrams for different primary reflections. (L.C.J.A.)

Influence of seismic diffraction for high-resolution imaging: applications in offshore Malaysia

Science.gov (United States)

Bashir, Yasir; Ghosh, Deva Prasad; Sum, Chow Weng

2018-04-01

Small-scale geological discontinuities are not easy to detect and image in seismic data, as these features represent themselves as diffracted rather than reflected waves. However, the combined reflected and diffracted image contains full wave information and is of great value to an interpreter, for instance enabling the identification of faults, fractures, and surfaces in built-up carbonate. Although diffraction imaging has a resolution below the typical seismic wavelength, if the wavelength is much smaller than the width of the discontinuity then interference effects can be ignored, as they would not play a role in generating the seismic diffractions. In this paper, by means of synthetic examples and real data, the potential of diffraction separation for high-resolution seismic imaging is revealed and choosing the best method for preserving diffraction are discussed. We illustrate the accuracy of separating diffractions using the plane-wave destruction (PWD) and dip frequency filtering (DFF) techniques on data from the Sarawak Basin, a carbonate field. PWD is able to preserve the diffraction more intelligently than DFF, which is proven in the results by the model and real data. The final results illustrate the effectiveness of diffraction separation and possible imaging for high-resolution seismic data of small but significant geological features.

Trapping of microwave radiation in hollow polypyrrole microsphere through enhanced internal reflection: A novel approach

Science.gov (United States)

Panigrahi, Ritwik; Srivastava, Suneel K.

2015-01-01

In present work, spherical core (polystyrene, PS)/shell (polypyrrole, PPy) has been synthesized via in situ chemical oxidative copolymerization of pyrrole (Py) on the surface of sulfonated PS microsphere followed by the formation of hollow polypyrrole (HPPy) shell by dissolving PS inner core in THF. Thereafter, we first time established that such fabricated novel art of morphology acts as a conducting trap in absorbing electromagnetic (EM) wave by internal reflection. Further studies have been extended on the formation of its silver nanocomposites HPPy/Ag to strengthen our contention on this novel approach. Our investigations showed that electromagnetic interference (EMI) shielding efficiency (SE) of HPPy (34.5-6 dB) is significantly higher compared to PPy (20-5 dB) in the frequency range of 0.5-8 GHz due to the trapping of EM wave by internal reflection. We also observed that EMI shielding is further enhanced to 59-23 in 10 wt% Ag loaded HPPy/Ag-10. This is attributed to the simultaneous contribution of internal reflection as well as reflection from outer surface. Such high EMI shielding capacity using conducting polymers are rarely reported.

The Advantages of an Attenuated Total Internal Reflection Infrared Microspectroscopic Imaging Technique for the Analysis of Polymer Laminates.

Science.gov (United States)

Ling, Chen; Sommer, André J

2015-06-01

Until recently, the analysis of polymer laminates using infrared microspectroscopy involved the painstaking separation of individual layers by dissection or by obtaining micrometer thin cross-sections. The latter usually requires the expertise of an individual trained in microtomy and even then, the very structure of the laminate could affect the outcome of the spectral results. The recent development of attenuated total internal reflection (ATR) infrared microspectroscopy imaging has provided a new avenue for the analysis of these multilayer structures. This report compares ATR infrared microspectroscopy imaging with conventional transmission infrared microspectroscopy imaging. The results demonstrate that the ATR method offers improved spatial resolution, eliminates a variety of competing optical processes, and requires minimal sample preparation relative to transmission measurements. These advantages were illustrated using a polymer laminate consisting of 11 different layers whose thickness ranged in size from 4-20 μm. The spatial resolution achieved by using an ATR-FTIR (Fourier transform infrared spectroscopy) imaging technique was diffraction limited. Contrast in the ATR images was enhanced by principal component analysis.

11. international conference on elastic and diffractive scattering: towards high energy frontiers

International Nuclear Information System (INIS)

2005-01-01

This conference is held every 2 years. Every time these conferences on elastic and diffractive scattering adapt their content to the most recent experimental and theoretical results concerning not only quantum chromodynamics (QCD) but also other fields of particle physics where diffractive physics is present. This year, besides classical themes such as: -) forward scattering, -) total cross-sections, -) real parts, and -) pomeron and odderon, the participants have addressed many other subjects such as: -) LHC physics, -) non-perturbative approaches to high-energy scattering, -) the dipole model, -) small-x evolution, -) hard diffraction in QCD, -) nuclear shadowing, -) diffractive Higgs studies, -) spin effects, -) 4-quarks and 5-quarks, or -) B-physics

11. international conference on elastic and diffractive scattering: towards high energy frontiers

Energy Technology Data Exchange (ETDEWEB)

NONE

2005-07-01

This conference is held every 2 years. Every time these conferences on elastic and diffractive scattering adapt their content to the most recent experimental and theoretical results concerning not only quantum chromodynamics (QCD) but also other fields of particle physics where diffractive physics is present. This year, besides classical themes such as: -) forward scattering, -) total cross-sections, -) real parts, and -) pomeron and odderon, the participants have addressed many other subjects such as: -) LHC physics, -) non-perturbative approaches to high-energy scattering, -) the dipole model, -) small-x evolution, -) hard diffraction in QCD, -) nuclear shadowing, -) diffractive Higgs studies, -) spin effects, -) 4-quarks and 5-quarks, or -) B-physics.

Consideration of Wall Reflection and Diffraction in the Room Acoustic Prediction Using the Phased Beam Tracing Method

DEFF Research Database (Denmark)

Jeong, Cheol-Ho

2007-01-01

of the applicability of the geometrical methods to mid frequency. Several studies on this method have demonstrated a good possibility to analyze the sound field in an enclosure at mid frequency. In this study, further considerations on wall reflection and diffraction have been investigated. The main suggestions...... of representing the negative real part was discussed. The PBTM result shows a good agreement with the measurement especially in the early part of impulse response and at mid frequency. The new method of ii binaural simulation for the PBTM was suggested. The peculiar feature of frequency domain calculation......The geometrical acoustics methods have been used to simulate the acoustics of rooms at high frequencies whereas the wave based methods have been devoted to calculate the low frequency response. The modified method, so called phased geometrical acoustics technique, was suggested for the extension...

Dynamical theory of neutron diffraction

International Nuclear Information System (INIS)

Sears, V.F.

1978-01-01

We present a review of the dynamical theory of neutron diffraction by macroscopic bodies which provides the theoretical basis for the study of neutron optics. We consider both the theory of dispersion, in which it is shown that the coherent wave in the medium satisfies a macroscopic one-body Schroedinger equation, and the theory of reflection, refraction, and diffraction in which the above equation is solved for a number of special cases of interest. The theory is illustrated with the help of experimental results obtained over the past 10 years by a number of new techniques such as neutron gravity refractometry. Pendelloesung interference, and neutron interferometry. (author)

Laue 2007: international workshop on advanced Laue diffraction in frontier science

International Nuclear Information System (INIS)

Adachi, S.I.; Akgul, G.; Aksoy, F.; Andersen, K.; Andersson, M.; Anfinrud, Ph.; Baruchel, J.; Bastie, P.; Bau, R.; Blakeley, M.; Bourgeois, D.; Brau, D.; Bravin, A.; Cammarata, M.; Christensen, M.; Cole, J.; Courtois, P.; Cousson, A.; Eggonopoulos-Papadopoulos, B.; Daoud-Aladine, M.A.; Dera, P.; Feng, R.; Fiedler, St.; Fischer, H.; Fisher, St.; Folami, S.; Fosu, M.A.; Fuente, F.; Fullagar, W.; Fulla Marsa, D.; Ghosh, R.; Giles, C.; Goossens, D.; Goujon, A.; Gutmann, M.; Heger, G.; Henry, E.; Hewat, A.; Hossmann, Ch.; Ivanov, A.; Jauch, W.; Jorgensen, R.; Katona, G.; Keen, D.; Kong, Q.; Koshihara, Sh.Y.; Lauss, B.; Laue, M.V.; Lecomte, C.; Legrand, V.; Lemee-Cailleau, M.H.; Marmeggi, J.C.; Martinez-Criado, G.; Mason, S.; McIntyre, G.; Mailleur, F.; Micha, J.S.; Moffat, K.; Mohammed Mustapha, A.; Ouladdiaf, B.; Pahl, R.; Parise, J.; Pearson, A.; Pecaut, J.; Popov, A.; Prokleska, J.; Raitman, E.; Ren, Z.; Rodriguez-Carvajal, J.; Sasaki, J.; Schmidt, M.; Schotte, F.; Stirling, W.; Suominen Fuller, M.; Tanaka, I.; Timmins, P.; Tomking, P.; Turner, M.; Van Thor, J.; Vettier, Ch.; Wildes, A.; Wilson, Ch.; Wohri, A.; Wulf, M.; Zhao, Y.

2007-01-01

Laue diffraction is currently undergoing a lively renaissance due to new instrumental developments at both synchrotron X-ray and neutron sources. The aim of the workshop Laue-2007 is to offer state-of-the-art experimental methods and hands-on experience of data analysis for exploration, using single-crystal Laue diffraction, of the crystalline structure of complex materials in extreme cases. The oral sessions cover the following topics: -) history and renaissance of Laue diffraction, -) modern X-ray techniques, -) modern neutron techniques, -) applications, -) analysis and software demonstrations including hands-on experience, and -) future directions. This document gathers the abstracts of the presentations and of the posters

Laue 2007: international workshop on advanced Laue diffraction in frontier science

Energy Technology Data Exchange (ETDEWEB)

Adachi, S I; Akgul, G; Aksoy, F; Andersen, K; Andersson, M; Anfinrud, Ph; Baruchel, J; Bastie, P; Bau, R; Blakeley, M; Bourgeois, D; Brau, D; Bravin, A; Cammarata, M; Christensen, M; Cole, J; Courtois, P; Cousson, A; Eggonopoulos-Papadopoulos, B; Daoud-Aladine, M A; Dera, P; Feng, R; Fiedler, St; Fischer, H; Fisher, St; Folami, S; Fosu, M A; Fuente, F; Fullagar, W; Fulla Marsa, D; Ghosh, R; Giles, C; Goossens, D; Goujon, A; Gutmann, M; Heger, G; Henry, E; Hewat, A; Hossmann, Ch; Ivanov, A; Jauch, W; Jorgensen, R; Katona, G; Keen, D; Kong, Q; Koshihara, Sh Y; Lauss, B; Laue, M V; Lecomte, C; Legrand, V; Lemee-Cailleau, M H; Marmeggi, J C; Martinez-Criado, G; Mason, S; McIntyre, G; Mailleur, F; Micha, J S; Moffat, K; Mohammed Mustapha, A; Ouladdiaf, B; Pahl, R; Parise, J; Pearson, A; Pecaut, J; Popov, A; Prokleska, J; Raitman, E; Ren, Z; Rodriguez-Carvajal, J; Sasaki, J; Schmidt, M; Schotte, F; Stirling, W; Suominen Fuller, M; Tanaka, I; Timmins, P; Tomking, P; Turner, M; Van Thor, J; Vettier, Ch; Wildes, A; Wilson, Ch; Wohri, A; Wulf, M; Zhao, Y

2007-07-01

Laue diffraction is currently undergoing a lively renaissance due to new instrumental developments at both synchrotron X-ray and neutron sources. The aim of the workshop Laue-2007 is to offer state-of-the-art experimental methods and hands-on experience of data analysis for exploration, using single-crystal Laue diffraction, of the crystalline structure of complex materials in extreme cases. The oral sessions cover the following topics: -) history and renaissance of Laue diffraction, -) modern X-ray techniques, -) modern neutron techniques, -) applications, -) analysis and software demonstrations including hands-on experience, and -) future directions. This document gathers the abstracts of the presentations and of the posters.

X-ray diffraction study of surface-layer structure in parallel grazing rays

International Nuclear Information System (INIS)

Shtypulyak, N.I.; Yakimov, I.I.; Litvintsev, V.V.

1989-01-01

An x-ray diffraction method is described for study of thin polycrystalline and amorphous films and surface layers in an extremely asymmetrical diffraction system in parallel grazing rays using a DRON-3.0 diffractometer. The minimum grazing angles correspond to diffraction under conditions of total external reflection and a layer depth of ∼ 2.5-8 nm

The measurement of internal stress fields in weldments and around cracks using high resolution neutron diffraction

International Nuclear Information System (INIS)

Allen, A.J.; Hutchings, M.T.; Windsor, C.G.

1987-01-01

The paper describes and illustrates the capability of neutron diffraction to measure the complete internal lattice macrostrain field, and hence the stress field, within steel components and weldments arising from their fabrication. A brief outline is given of the theory of the neutron method. The experimental considerations are discussed. The method is illustrated by its application to the measurement of the stress distribution in a:- uniaxially stressed mild steel rod, a double - V test weld, a tube-plate weld, and a cracked fatigue test specimen. (U.K.)

Structural characterization of self-assembled semiconductor islands by three-dimensional X-ray diffraction mapping in reciprocal space

International Nuclear Information System (INIS)

Holy, V.; Mundboth, K.; Mokuta, C.; Metzger, T.H.; Stangl, J.; Bauer, G.; Boeck, T.; Schmidbauer, M.

2008-01-01

For the first time self-organized epitaxially grown semiconductor islands were investigated by a full three-dimensional mapping of the scattered X-ray intensity in reciprocal space. Intensity distributions were measured in a coplanar diffraction geometry around symmetric and asymmetric Bragg reflections. The 3D intensity maps were compared with theoretical simulations based on continuum-elasticity simulations of internal strains in the islands and on kinematical scattering theory whereby local chemical composition and strain profiles of the islands were retrieved

Super-virtual interferometric diffractions as guide stars

KAUST Repository

Dai, Wei

2011-01-01

A significant problem in seismic imaging is seismically seeing below salt structures: large velocity contrasts and the irregular geometry of the salt-sediment interface strongly defocus both the downgoing and upgoing seismic wavefields. This can result in severely defocused migration images so as to seismically render some subsalt reserves invisible. The potential cure is a good estimate of the subsalt and salt velocity distributions, but that is also the problem: severe velocity contrasts prevent the appearance of coherent subsalt reflections in the surface records so that MVA or tomographic methods can become ineffective. We now present an interferometric method for extracting the diffraction signals that emanate from diffractors, also denoted as seismic guide stars. The signal-to-noise ratio of these interferometric diffractions is enhanced by N, where N is the number of source points coincident with the receiver points. Thus, diffractions from subsalt guide stars can then be rendered visible and so can be used for velocity analysis, migration, and focusing of subsalt reflections. Both synthetic and field data records are used to demonstrate the benefits and limitations of this method. © 2011 Society of Exploration Geophysicists.

Diffraction anomalous fine structure using X-ray anomalous dispersion

International Nuclear Information System (INIS)

Soejima, Yuji; Kuwajima, Shuichiro

1998-01-01

A use of X-ray anomalous dispersion effects for structure investigation has recently been developed by using synchrotron radiation. One of the interesting method is the observation of anomalous fine structure which arise on diffraction intensity in energy region of incident X-ray at and higher than absorption edge. The phenomenon is so called Diffraction Anomalous Fine Structure (DAFS). DAFS originates in the same physical process an that of EXAFS: namely photoelectric effect at the corresponding atom and the interaction of photoelectron waves between the atom and neighboring atoms. In contrast with EXAFS, the method is available for only the crystalline materials, but shows effective advantages of the structure investigations by a use of diffraction: one is the site selectivity and the other is space selectivity. In the present study, demonstrations of a use of X-ray anomalous dispersion effect for the superstructure determination will be given for the case of PbZrO 3 , then recent trial investigations of DAFS in particular on the superlattice reflections will be introduced. In addition, we discuss about Forbidden Reflection near Edge Diffraction (FRED) which is more recently investigated as a new method of the structure analysis. (author)

Small angle X ray diffraction investigation of twinned opal_like structures

NARCIS (Netherlands)

Samusev, A.K.; Sinev, I.S.; Samusev, K.B.; Rybin, M.V.; Mistonov, A.A.; Grigoryeva, N.A.; Grigoriev, S.V.; Petukhov, A.V.; Byelov, D.; Trofimova, E.Y.; Kurdyukov, D.A.; Golubev, V.G.; Limonov, M.F.

2012-01-01

Small angle X ray diffraction from synthetic opal films has been investigated as a function of the orientation of the sample. All the observed (hkl) diffraction reflections have been interpreted. The reconstruct tion of the reciprocal lattice of the studied opal films has been carried out. The

DIRC dreams: research directions for the next generation of internally reflected imaging counters

International Nuclear Information System (INIS)

Ratcliff, Blair N.; Spanier, Stefan

1999-01-01

Some conceptual design features of the total internally reflecting, imaging Cherenkov counter (DIRC) are described. Limits of the DIRC approach to particle identification, and a few features of alternative DIRC designs, are briefly explored

Modifications to 8x8 dynamical theory: Polarizations redefined according to x-ray diffraction convention

International Nuclear Information System (INIS)

Macrander, A.T.; Blasdell, R.C.

1993-09-01

Dynamical x-ray diffraction theory can be cast in matrix form. In recent years, an 8x8 matrix theory was developed that treated asymmetric reflections from strained crystals. The polarization of the incident, specularly reflected, reflected diffracted, transmitted diffracted, and transmitted electromagnetic wave fields were all defined as s or p. That is, polarizations were defined with respect to the plane containing the incident beam direction and the surface normal. The authors present modifications of the theory to treat σ and π polarizations for Bragg diffraction from asymmetric planes, that is, for polarizations defined with respect to the plane containing the incident beam direction and the reciprocal lattice vector for Bragg diffraction. They present results of this theory for unstrained crystals in the inclined geometry. In this geometry the incident beam wavevector, the reciprocal lattice vector, and the surface normal are not coplanar. The inclined crystal geometry appears promising for use in a high-heat-load monochromator for undulator radiation at the Advanced Photon Source. As expected, they find a weak π-polarization component in the diffracted beam when the polarization of the incident beam is pure σ

High temperature neutron diffraction study of LaPO4

International Nuclear Information System (INIS)

Mishra, S.K.; Mittal, R.; Ningthoujam, R.S.; Vatsa, R.K.; Hansen, T.

2016-01-01

We report high temperature powder neutron diffractions study in LaPO 4 using high-flux D20 neutron diffractometer in the Institut Laue-Langevin, France. The measurements were carried out in high resolution mode (incident neutron wavelength 1.36 A) at various temperature upto 900°C. CarefuI inspection of temperature dependence of diffraction data showed appearance and disappearance of certain Bragg's reflections above 1273 K. It is a signature of structural phase transition. Rietveld refinement of the powder diffraction data revealed that diffraction patterns at and above 800°C could be indexed using the monoclinic structure with P21/n space group. Detail analysis for identify the water molecules is under investigation. (author)

The internal strain parameter of gallium arsenide measured by energy-dispersive X-ray diffraction

International Nuclear Information System (INIS)

Cousins, C.S.G.; Sheldon, B.J.; Webster, G.E.; Gerward, L.; Selsmark, B.; Staun Olsen, J.

1989-01-01

The internal strain parameter of GaAs has been measured by observing the stress-dependence of the integrated intensity of the weak 006 reflection, with the compressive stress along the [1anti 10] axis. An energy-dispersive technique was employed so that the reflection could be obtained at a photon energy close to the minimum in the structure factor, thereby approaching closely the strictly-forbidden condition that applies at any energy in the diamond structure. A value anti A=-0.138±0.005, equivalent to a bond-bending parameter ζ=0.55=0.02, has been found. This is in good agreement with recent theoretical calculations and indirect determinations related to the bandstructure of GaAs. (orig.)

Stress induced modulation of magnetic domain diffraction of single crystalline yttrium iron garnet

Science.gov (United States)

Mito, Shinichiro; Yoshihara, Yuki; Takagi, Hiroyuki; Inoue, Mitsuteru

2018-05-01

Stress induced modulation of the diffraction angle and efficiency of the light reflected from a stripe-domain magnetic garnet was demonstrated. The spacing of the magnetic domain was changed using the inverse magnetostriction effect. The sample structure was a piezo actuator/Al reflection layer/magnetic garnet substrate. A diffraction angle between the 0th and 1st ordered light was changed from 9.12 deg. to 10.20 deg. This result indicates that the domain spacing was changed from 3.3 μm to 3.0 μm. The change of the diffraction angle was irreversible for the voltage. However, reversible, linear and continuous change of the diffraction efficiency was observed. These results could be applicable for a voltage-driven optical solid state light deflector with low power consumption and high switching speed.

ELiXIR—Solid-State Luminaire With Enhanced Light Extraction by Internal Reflection

Science.gov (United States)

Allen, Steven C.; Steckl, Andrew J.

2007-06-01

A phosphor-converted light-emitting diode (pcLED) luminaire featuring enhanced light extraction by internal reflection (ELiXIR) with efficacy of 60 lm/W producing 18 lumens of yellowish green light at 100 mA is presented. The luminaire consists of a commercial blue high power LED, a polymer hemispherical shell lens with interior phosphor coating, and planar aluminized reflector. High extraction efficiency of the phosphor-converted light is achieved by separating the phosphor from the LED and using internal reflection to steer the light away from lossy reflectors and the LED package and out of the device. At 10 and 500 mA, the luminaire produces 2.1 and 66 lumens with efficacies of 80 and 37 lm/W, respectively. Technological improvements over existing commercial LEDs, such as more efficient pcLED packages or, alternatively, higher efficiency green or yellow for color mixing, will be essential to achieving 150 200 lm/W solid-state lighting. Advances in both areas are demonstrated.

Quantitative phase analysis by neutron diffraction

Energy Technology Data Exchange (ETDEWEB)

Lee, Chang Hee; Song, Su Ho; Lee, Jin Ho; Shim, Hae Seop [Korea Atomic Energy Research Institute, Taejon (Korea)

1999-06-01

This study is to apply quantitative phase analysis (QPA) by neutron diffraction to the round robin samples provided by the International Union of Crystallography(IUCr). We measured neutron diffraction patterns for mixed samples which have several different weight percentages and their unique characteristic features. Neutron diffraction method has been known to be superior to its complementary methods such as X-ray or Synchrotron, but it is still accepted as highly reliable under limited conditions or samples. Neutron diffraction has strong capability especially on oxides due to its scattering cross-section of the oxygen and it can become a more strong tool for analysis on the industrial materials with this quantitative phase analysis techniques. By doing this study, we hope not only to do one of instrument performance tests on our HRPD but also to improve our ability on the analysis of neutron diffraction data by comparing our QPA results with others from any advanced reactor facilities. 14 refs., 4 figs., 6 tabs. (Author)

Composition determination of quaternary GaAsPN layers from single X-ray diffraction measurement of quasi-forbidden (002) reflection

Energy Technology Data Exchange (ETDEWEB)

Tilli, J.-M., E-mail: juha-matti.tilli@iki.fi; Jussila, H.; Huhtio, T.; Sopanen, M. [Department of Micro and Nanosciences, Aalto University, P.O. Box 13500, FI-00076 Aalto (Finland); Yu, K. M. [Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States)

2014-05-28

GaAsPN layers with a thickness of 30 nm were grown on GaP substrates with metalorganic vapor phase epitaxy to study the feasibility of a single X-ray diffraction (XRD) measurement for full composition determination of quaternary layer material. The method is based on the peak intensity of a quasi-forbidden (002) reflection, which is shown to vary with changing arsenic content for GaAsPN. The method works for thin films with a wide range of arsenic contents and shows a clear variation in the reflection intensity as a function of changing layer composition. The obtained thicknesses and compositions of the grown layers are compared with accurate reference values obtained by Rutherford backscattering spectroscopy combined with nuclear reaction analysis measurements. Based on the comparison, the error in the XRD defined material composition becomes larger with increasing nitrogen content and layer thickness. This suggests that the dominating error source is the deteriorated crystal quality due to the nonsubstitutional incorporation of nitrogen into the crystal lattice and strain relaxation. The results reveal that the method overestimates the arsenic and nitrogen content within error margins of about 0.12 and about 0.025, respectively.

Fundamentals of the physical theory of diffraction

CERN Document Server

Ufimtsev, Pyotr Ya

2014-01-01

A complete presentation of the modern physical theory of diffraction and its applications, by the world's leading authority on the topicExtensive revisions and additions to the first edition yield a second edition that is 492 pages in length, with 122 figuresNew sections examine the nature of polarization coupling, and extend the theory of shadow radiation and reflection to opaque objectsThis book features end-of-chapter problems and a solutions manual for university professors and graduate studentsMATLAB codes presented in appendices allow for quick numeric calculations of diffracted waves

Effect of surface plasmon polaritons on the sensitivity of refractive index measurement using total internal reflection method

International Nuclear Information System (INIS)

Roshan Entezar, S.

2015-01-01

The phase difference between two p-polarized and s-polarized plane waves which are reflected under total internal reflection from the base of a prism with a thin metal coating is studied. Typically such a quantity can be used to measure the refractive index of a test material using the total internal reflection method. It is shown that due to the excitation of surface plasmon polaritons at the interface between the tested dielectric material and the thin metal layer, the p-polarized light experiences a large phase shift which enlarges the phase difference between the p-polarized and the s-polarized waves. As a result, the sensitivity of refractive index measurement increases and the error in determining the refractive index decreases. - Highlights: • Phase difference of totally internally reflected p and s polarized beams is studied. • Excitation of the surface wave increases the phase shift of the p-polarized light. • The sensitivity of refractive index measurement increases by using a coated prism. • The error in determining the refractive index decreases using the coated prism

Neutron diffraction on polymorphic phases of phospholipids

International Nuclear Information System (INIS)

Adachi, Tomohiro; Furusaka, Michihiro; Otomo, Toshiya; Hatta, Ichiro

2001-01-01

Small angle neutron diffraction experiments were performed in DPPC and DPPC/cholesterol systems. We investigated the DPPC-d62 bilayers without cholesterol and the DPPC-d75 bilayers with 5 and 15 mol% cholesterol. For DPPC-d62 systems, in the gel and fluid phase, the reflections up to third order from lamellar structure were observed. Scattering length density profiles of these systems were generated. They show that the packing density of hydrocarbon chain in gel phase is higher than in fluid phase. We show that the neutron diffraction experiment is effective on observing the packing and the scattering length density of the hydrocarbon chain. On the other hand, for DPPC-d75/cholesterol systems, only the reflection from the ripple structure was observed. It shows that cholesterol is periodically localized in accordance with ripple structure forming a periodic bandlike structure parallel to a ridge of the ripple structure. (author)

X-ray diffraction characteristics of curved monochromators for sychrotron radiation

International Nuclear Information System (INIS)

Boeuf, A.; Rustichelli, F.; Mazkedian, S.; Puliti, P.; Melone, S.

1978-01-01

A theoretical study is presented concerning the diffraction characteristics of curved monochromators for X-ray synchrotron radiation used at the laboratories of Hamburg, Orsay and Stanford. The investigation was performed by extending to the X-ray case a simple model recently developed and fruitfully employed to describe the neutron diffraction properties of curved monochromators. Several diffraction patterns were obtained corresponding to different monochromator materials (Ge, Si) used by the different laboratories, for different reflecting planes (111), (220), asymmetry angles, X-ray wave-lengths (Mo Kα, Cu Kα, Cr Kα) and curvature radii. The results are discussed in physical terms and their implications on the design of curved monochromators for synchrotron radiation are presented. In particular, the study shows that all the monochromators used in the different laboratories should behave practically as perfect crystals and therefore should have a very low integrated reflectivity corresponding to an optimized wavelength passband Δlambda/lambda approximately 10 -4 . The gain that can be obtained by increasing the curvature, by introducing a gradient in the lattice spacing or by any other kind of imperfection is quite limited and much lower than the desirable value. The adopted model can help in obtaining a possible moderate gain in intensity by also taking into consideration other parameters, such as crystal material, reflecting plane, asymmetry of the reflection and X-ray wavelength. (Auth.)

'Ab initio' structure solution from electron diffraction data obtained by a combination of automated diffraction tomography and precession technique

International Nuclear Information System (INIS)

Mugnaioli, E.; Gorelik, T.; Kolb, U.

2009-01-01

Using a combination of our recently developed automated diffraction tomography (ADT) module with precession electron technique (PED), quasi-kinematical 3D diffraction data sets of an inorganic salt (BaSO 4 ) were collected. The lattice cell parameters and their orientation within the data sets were found automatically. The extracted intensities were used for 'ab initio' structure analysis by direct methods. The data set covered almost the complete set of possible symmetrically equivalent reflections for an orthorhombic structure. The structure solution in one step delivered all heavy (Ba, S) as well as light atoms (O). Results of the structure solution using direct methods, charge flipping and maximum entropy algorithms as well as structure refinement for three different 3D electron diffraction data sets were presented.

Towards automated diffraction tomography: Part I-Data acquisition

International Nuclear Information System (INIS)

Kolb, U.; Gorelik, T.; Kuebel, C.; Otten, M.T.; Hubert, D.

2007-01-01

The ultimate aim of electron diffraction data collection for structure analysis is to sample the reciprocal space as accurately as possible to obtain a high-quality data set for crystal structure determination. Besides a more precise lattice parameter determination, fine sampling is expected to deliver superior data on reflection intensities, which is crucial for subsequent structure analysis. Traditionally, three-dimensional (3D) diffraction data are collected by manually tilting a crystal around a selected crystallographic axis and recording a set of diffraction patterns (a tilt series) at various crystallographic zones. In a second step, diffraction data from these zones are combined into a 3D data set and analyzed to yield the desired structure information. Data collection can also be performed automatically, with the recent advances in tomography acquisition providing a suitable basis. An experimental software module has been developed for the Tecnai microscope for such an automated diffraction pattern collection while tilting around the goniometer axis. The module combines STEM imaging with diffraction pattern acquisition in nanodiffraction mode. It allows automated recording of diffraction tilt series from nanoparticles with a size down to 5 nm

Dynamic theory of neutron diffraction from a moving grating

Energy Technology Data Exchange (ETDEWEB)

Bushuev, V. A., E-mail: vabushuev@yandex.ru [Moscow State University (Russian Federation); Frank, A. I.; Kulin, G. V. [Joint Institute for Nuclear Research (Russian Federation)

2016-01-15

A multiwave dynamic theory of diffraction of ultracold neutrons from a moving phase grating has been developed in the approximation of coupled slowly varying amplitudes of wavefunctions. The effect of the velocity, period, and height of grooves of the grating, as well as the spectral angular distribution of the intensity of incident neurons, on the discrete energy spectrum and the intensity of diffraction reflections of various orders has been analyzed.

Seismic reflection imaging, accounting for primary and multiple reflections

Science.gov (United States)

Wapenaar, Kees; van der Neut, Joost; Thorbecke, Jan; Broggini, Filippo; Slob, Evert; Snieder, Roel

2015-04-01

Imaging of seismic reflection data is usually based on the assumption that the seismic response consists of primary reflections only. Multiple reflections, i.e. waves that have reflected more than once, are treated as primaries and are imaged at wrong positions. There are two classes of multiple reflections, which we will call surface-related multiples and internal multiples. Surface-related multiples are those multiples that contain at least one reflection at the earth's surface, whereas internal multiples consist of waves that have reflected only at subsurface interfaces. Surface-related multiples are the strongest, but also relatively easy to deal with because the reflecting boundary (the earth's surface) is known. Internal multiples constitute a much more difficult problem for seismic imaging, because the positions and properties of the reflecting interfaces are not known. We are developing reflection imaging methodology which deals with internal multiples. Starting with the Marchenko equation for 1D inverse scattering problems, we derived 3D Marchenko-type equations, which relate reflection data at the surface to Green's functions between virtual sources anywhere in the subsurface and receivers at the surface. Based on these equations, we derived an iterative scheme by which these Green's functions can be retrieved from the reflection data at the surface. This iterative scheme requires an estimate of the direct wave of the Green's functions in a background medium. Note that this is precisely the same information that is also required by standard reflection imaging schemes. However, unlike in standard imaging, our iterative Marchenko scheme retrieves the multiple reflections of the Green's functions from the reflection data at the surface. For this, no knowledge of the positions and properties of the reflecting interfaces is required. Once the full Green's functions are retrieved, reflection imaging can be carried out by which the primaries and multiples are

Superresolution confocal technology for displacement measurements based on total internal reflection

International Nuclear Information System (INIS)

Kuang Cuifang; Hao Xiang; Wang Tingting; Liu Xu; Ali, M. Yakut

2010-01-01

In order to achieve a higher axial resolution for displacement measurement, a novel method is proposed based on total internal reflection filter and confocal microscope principle. A theoretical analysis of the basic measurement principles is presented. The analysis reveals that the proposed confocal detection scheme is effective in enhancing the resolution of nonlinearity of the reflectance curve greatly. In addition, a simple prototype system has been developed based on the theoretical analysis and a series of experiments have been performed under laboratory conditions to verify the system feasibility, accuracy, and stability. The experimental results demonstrate that the axial resolution in displacement measurements is better than 1 nm in a range of 200 nm which is threefold better than that can be achieved using the plane reflector.

Superresolution confocal technology for displacement measurements based on total internal reflection.

Science.gov (United States)

Kuang, Cuifang; Ali, M Yakut; Hao, Xiang; Wang, Tingting; Liu, Xu

2010-10-01

In order to achieve a higher axial resolution for displacement measurement, a novel method is proposed based on total internal reflection filter and confocal microscope principle. A theoretical analysis of the basic measurement principles is presented. The analysis reveals that the proposed confocal detection scheme is effective in enhancing the resolution of nonlinearity of the reflectance curve greatly. In addition, a simple prototype system has been developed based on the theoretical analysis and a series of experiments have been performed under laboratory conditions to verify the system feasibility, accuracy, and stability. The experimental results demonstrate that the axial resolution in displacement measurements is better than 1 nm in a range of 200 nm which is threefold better than that can be achieved using the plane reflector.

Confocal Microscope Alignment of Nanocrystals for Coherent Diffraction Imaging

International Nuclear Information System (INIS)

Beitra, Loren; Watari, Moyu; Matsuura, Takashi; Shimamoto, Naonobu; Harder, Ross; Robinson, Ian

2010-01-01

We have installed and tested an Olympus LEXT confocal microscope at the 34-ID-C beamline of the Advanced Photon Source (APS). The beamline is for Coherent X-ray Diffraction (CXD) experiments in which a nanometre-sized crystal is aligned inside a focussed X-ray beam. The microscope was required for three-dimensional (3D) sample alignment to get around sphere-of-confusion issues when locating Bragg peaks in reciprocal space. In this way, and by use of strategic sample preparations, we have succeeded in measuring six Bragg peaks from a single 200 nm gold crystal and obtained six projections of its internal displacement field. This enables the clear identification of stacking-fault bands within the crystal. The confocal alignment method will allow a full determination of the strain tensor provided three or more Bragg reflections from the same crystal are found.

Single-pulse x-ray diffraction using polycapillary optics for in situ dynamic diffraction

Energy Technology Data Exchange (ETDEWEB)

Maddox, B. R., E-mail: maddox3@llnl.gov; Akin, M. C., E-mail: akin1@llnl.gov; Teruya, A.; Hunt, D.; Hahn, D.; Cradick, J. [Lawrence Livermore National Laboratory, Livermore, California 94550 (United States); Morgan, D. V. [National Security Technologies LLC, Los Alamos, New Mexico 87544 (United States)

2016-08-15

Diagnostic use of single-pulse x-ray diffraction (XRD) at pulsed power facilities can be challenging due to factors such as the high flux and brightness requirements for diffraction and the geometric constraints of experimental platforms. By necessity, the x-ray source is usually positioned very close, within a few inches of the sample. On dynamic compression platforms, this puts the x-ray source in the debris field. We coupled x-ray polycapillary optics to a single-shot needle-and-washer x-ray diode source using a laser-based alignment scheme to obtain high-quality x-ray diffraction using a single 16 ns x-ray pulse with the source >1 m from the sample. The system was tested on a Mo sample in reflection geometry using 17 keV x-rays from a Mo anode. We also identified an anode conditioning effect that increased the x-ray intensity by 180%. Quantitative measurements of the x-ray focal spot produced by the polycapillary yielded a total x-ray flux on the sample of 3.3 ± 0.5 × 10{sup 7} molybdenum Kα photons.

Total internal reflection fluorescence (TIRF) microscopy for real-time imaging of nanoparticle-cell plasma membrane interaction

DEFF Research Database (Denmark)

Parhamifar, Ladan; Moghimi, Seyed Moien

2012-01-01

Nanoparticulate systems are widely used for site-specific drug and gene delivery as well as for medical imaging. The mode of nanoparticle-cell interaction may have a significant effect on the pathway of nanoparticle internalization and subsequent intracellular trafficking. Total internal reflection...

Smooth and rough Proteus mirabilis lipopolysaccharides studied by total internal reflection ellipsometry

International Nuclear Information System (INIS)

Gleńska-Olender, J.; Dworecki, K.; Sęk, S.; Kwinkowski, M.; Kaca, W.

2013-01-01

Total internal reflection ellipsometry (TIRE), a label-free optical detection technique for studying interactions between biomolecules, was used to examine the adsorption of various forms of lipopolysaccharides (LPSs) isolated from Proteus mirabilis S1959, R110, and R45 strains on a gold surface. The thickness of the adsorbed layers was determined by TIRE, with the average values for S1959, R110, and R45 LPS layers being 78 ± 5, 39 ± 3, and 12 ± 2 nm, respectively. The thickness of LPS layers corresponds to the presence and length of O-specific parts in P. mirabilis LPS molecules. Atomic force microscopy was used as a complementary technique for visualizing lipopolysaccharides on the surface. Force measurements seem to confirm the data obtained from TIRE experiments. - Highlights: • Proteus mirabilis lipopolysaccharides were adsorbed on the gold surface. • Thickness of adsorbed layers was determined by total internal reflection ellipsometry. • Atomic force microscopy was used to visualize lipopolysaccharide build-up on gold surface. • Time is important in the evolution of biomolecular film thickness created on gold surface

Smooth and rough Proteus mirabilis lipopolysaccharides studied by total internal reflection ellipsometry

Energy Technology Data Exchange (ETDEWEB)

Gleńska-Olender, J., E-mail: joannaglenska@wp.pl [Institute of Biology, Jan Kochanowski University, 25-406 Kielce (Poland); Świętokrzyski Biobank, Regional Science and Technology Center, 26-060 Chęciny (Poland); Dworecki, K. [Institute of Physics, Jan Kochanowski University, 25-406 Kielce (Poland); Sęk, S. [Department of Chemistry, University of Warsaw, 02-093 Warsaw (Poland); Kwinkowski, M.; Kaca, W. [Institute of Biology, Jan Kochanowski University, 25-406 Kielce (Poland)

2013-12-02

Total internal reflection ellipsometry (TIRE), a label-free optical detection technique for studying interactions between biomolecules, was used to examine the adsorption of various forms of lipopolysaccharides (LPSs) isolated from Proteus mirabilis S1959, R110, and R45 strains on a gold surface. The thickness of the adsorbed layers was determined by TIRE, with the average values for S1959, R110, and R45 LPS layers being 78 ± 5, 39 ± 3, and 12 ± 2 nm, respectively. The thickness of LPS layers corresponds to the presence and length of O-specific parts in P. mirabilis LPS molecules. Atomic force microscopy was used as a complementary technique for visualizing lipopolysaccharides on the surface. Force measurements seem to confirm the data obtained from TIRE experiments. - Highlights: • Proteus mirabilis lipopolysaccharides were adsorbed on the gold surface. • Thickness of adsorbed layers was determined by total internal reflection ellipsometry. • Atomic force microscopy was used to visualize lipopolysaccharide build-up on gold surface. • Time is important in the evolution of biomolecular film thickness created on gold surface.

Electron diffraction patterns with thermal diffuse scattering maxima around Kikuchi lines

International Nuclear Information System (INIS)

Karakhanyan, R. K.; Karakhanyan, K. R.

2011-01-01

Transmission electron diffraction patterns of silicon with thermal diffuse maxima around Kikuchi lines, which are analogs of the maxima of thermal diffuse electron scattering around point reflections, have been recorded. Diffuse maxima are observed only around Kikuchi lines with indices that are forbidden for the silicon structure. The diffraction conditions for forming these maxima are discussed.

DIRC Dreams Redux: Research Directions for the Next Generation of Internally Reflected Imaging Counters

Energy Technology Data Exchange (ETDEWEB)

Ratcliff, Blair N

2001-09-18

Some general conceptual design features of total internally reflecting, imaging Cherenkov counters (DIRCs) are described. Limits of the DIRC approach to particle identification and a few features of alternative DIRC designs are briefly explored.

Surface and interface strains studied by x-ray diffraction

International Nuclear Information System (INIS)

Akimoto, Koichi; Emoto, Takashi; Ichimiya, Ayahiko

1998-01-01

The authors have developed a technique of X-ray diffraction in order to measure strain fields near semiconductor surface and interface. The diffraction geometry is using the extremely asymmetric Bragg-case bulk reflection of a small incident angle to the surface and a large angle exiting from the surface. The incident angle of the X-rays is set near critical angle of total reflection by tuning X-ray energy of synchrotron radiation at the Photon Factory, Japan. For thermally grown-silicon oxide/Si(100) interface, the X-ray intensity of the silicon substrate 311 reflection has been measured. From comparison of the full width at half maxima (FWHM) of X-ray rocking curves of various thickness of silicon oxides, it has been revealed that silicon substrate lattice is highly strained in the thin (less than about 5 nm) silicon oxide/silicon system. In order to know the original silicon surface strain, the authors have also performed the same kind of measurements in the ultra-high vacuum chamber. A clean Si(111) 7x7 surface gives sharper X-ray diffraction peak than that of the native oxide/Si(111) system. From these measurements, it is concluded that the thin silicon oxide film itself gives strong strain fields to the silicon substrates, which may be the reason of the existence of the structural transition layer at the silicon oxide/Si interface

Computer programs for unit-cell determination in electron diffraction experiments

International Nuclear Information System (INIS)

Li, X.Z.

2005-01-01

A set of computer programs for unit-cell determination from an electron diffraction tilt series and pattern indexing has been developed on the basis of several well-established algorithms. In this approach, a reduced direct primitive cell is first determined from experimental data, in the means time, the measurement errors of the tilt angles are checked and minimized. The derived primitive cell is then checked for possible higher lattice symmetry and transformed into a proper conventional cell. Finally a least-squares refinement procedure is adopted to generate optimum lattice parameters on the basis of the lengths of basic reflections in each diffraction pattern and the indices of these reflections. Examples are given to show the usage of the programs

X-ray diffraction 2 - diffraction principles

International Nuclear Information System (INIS)

O'Connor, B.

1999-01-01

Full text: The computation of powder diffraction intensities is based on the principle that the powder pattern comprises the summation of the intensity contributions from each of the crystallites (or single crystals) in the material. Therefore, it is of value for powder diffractionists to appreciate the form of the expression for calculating single crystal diffraction pattern intensities. This knowledge is especially important for Rietveld analysis practitioners in terms of the (i) mathematics of the method and (ii) retrieving single crystal structure data from the literature. We consider the integrated intensity from a small single crystal being rotated at velocity ω through the Bragg angle θ for reflection (hkl).... I(hkl) = [l o /ω]. [e 4 /m 2 c 4 ]. [λ 3 δV F(hkl) 2 /υ 2 ].[(1+cos 2 2θ)/2sin2θ] where e, m and c are the usual fundamental constants; λ is the x-ray wavelength, δV is the crystallite volume; F(hkl) is the structure factor; υ is the unit cell volume; and (1+cos 2 θ)/2sin2θ] is the Lorentz-polarisation factor for an unpolarised incident beam. The expression does not include a contribution for extinction. The influence of factors λ, δV, F(hkl) and υ on the intensities should be appreciated by powder diffractionists, especially the structure factor, F(hkl), which is responsible for the fingerprint nature of diffraction patterns, such as the rise and fall of intensity from peak to peak. The structure factor expression represents the summation of the scattered waves from each of the j scattering centres (i e atoms) in the unit cell: F(hkl) Σ f j exp[2πi (h.x j +k.y i +l. z i )] T j . Symbol f is the scattering factor (representing the atom-type scattering efficiency); (x, y, z) are the fractional position coordinates of atom j within the unit cell; and T is the thermal vibration factor for the atom given by: T j = 8π 2 2 > sin 2 θ/λ 2 with 2 > being the mean-square vibration amplitude of the atom (assumed to be isotropic). The

Improving Collaborative Planning and Reflection Practices at International Baccalaureate Diploma Schools in Amman

Science.gov (United States)

Saa'd AlDin, Kawther

2014-01-01

In 2010, the International Baccalaureate (IB) Organization mandated that all its schools, including Diploma (DP) schools, adhere to the collaborative planning and reflection requirements, which emphasized the importance of integrating its theory of knowledge (TOK) core component into all disciplines. Many schools officials and educations in Amman…

Background modelling of diffraction data in the presence of ice rings

Directory of Open Access Journals (Sweden)

James M. Parkhurst

2017-09-01

Full Text Available An algorithm for modelling the background for each Bragg reflection in a series of X-ray diffraction images containing Debye–Scherrer diffraction from ice in the sample is presented. The method involves the use of a global background model which is generated from the complete X-ray diffraction data set. Fitting of this model to the background pixels is then performed for each reflection independently. The algorithm uses a static background model that does not vary over the course of the scan. The greatest improvement can be expected for data where ice rings are present throughout the data set and the local background shape at the size of a spot on the detector does not exhibit large time-dependent variation. However, the algorithm has been applied to data sets whose background showed large pixel variations (variance/mean > 2 and has been shown to improve the results of processing for these data sets. It is shown that the use of a simple flat-background model as in traditional integration programs causes systematic bias in the background determination at ice-ring resolutions, resulting in an overestimation of reflection intensities at the peaks of the ice rings and an underestimation of reflection intensities either side of the ice ring. The new global background-model algorithm presented here corrects for this bias, resulting in a noticeable improvement in R factors following refinement.

ATTENUATION OF DIFFRACTED MULTIPLES WITH AN APEX-SHIFTED TANGENT-SQUARED RADON TRANSFORM IN IMAGE SPACE

Directory of Open Access Journals (Sweden)

Alvarez Gabriel

2006-12-01

Full Text Available In this paper, we propose a method to attenuate diffracted multiples with an apex-shifted tangent-squared Radon transform in angle domain common image gathers (ADCIG . Usually, where diffracted multiples are a problem, the wave field propagation is complex and the moveout of primaries and multiples in data space is irregular. The method handles the complexity of the wave field propagation by wave-equation migration provided that migration velocities are reasonably accurate. As a result, the moveout of the multiples is well behaved in the ADCIGs. For 2D data, the apex-shifted tangent-squared Radon transform maps the 2D space image into a 3D space-cube model whose dimensions are depth, curvature and apex-shift distance.
Well-corrected primaries map to or near the zero curvature plane and specularly-reflected multiples map to or near the zero apex-shift plane. Diffracted multiples map elsewhere in the cube according to their curvature and apex-shift distance. Thus, specularly reflected as well as diffracted multiples can be attenuated simultaneously. This approach is illustrated with a segment of a 2D seismic line over a large salt body in the Gulf of Mexico. It is shown that ignoring the apex shift compromises the attenuation of the diffracted multiples, whereas the approach proposed attenuates both the specularly-reflected and the diffracted multiples without compromising the primaries.

Do people ruminate because they haven't digested their goals? The relations of rumination and reflection to goal internalization and ambivalence

DEFF Research Database (Denmark)

Thomsen, Dorthe Kirkegaard; Tønnesvang, Jan; Schnieber, Anette

2011-01-01

In three studies it was investigated whether rumination was related to less internalized self-regulation and goals and whether reflection was related to more internalized self-regulation and goals. In all studies students completed questionnaires measuring rumination, reflection, and internalizat...

Neutron forward diffraction by single crystal prisms

Indian Academy of Sciences (India)

We have derived analytic expressions for the deflection as well as transmitted fraction of monochromatic neutrons forward diffracted by a single crystal prism. In the vicinity of a Bragg reflection, the neutron deflection deviates sharply from that for an amorphous prism, exhibiting three orders of magnitude greater sensitivity to ...

X-ray diffraction analysis of InAs nanowires

International Nuclear Information System (INIS)

Davydok, Anton

2013-01-01

Semiconductor nanowires have attracted great interest as building blocks for future electronic and optoelectronic devices. The variability of the growth process opens the opportunity to control and combine the various properties tailoring for specific application. It was shown that the electrical and optical characteristics of the nanowires are strongly connected with their structure. Despite intensive research in this field, the growth process is still not fully understood. In particular, extensive real structure investigations are required. Most of the reports dedicated on the structural researches are based on the results of scanning electron microscopy (SEM) or transmission electron microscopy (TEM). SEM provides an image of the surface with nanostructures and is mainly used to describe the morphology of the sample, but it does not bring information about the internal structure, phase composition and defect structure. At the same time, the internal structure can be examined by TEM down to atomic scale. TEM image of good quality are very expensive due to the efforts in sample preparation and in localisation of a single object. All these aspects make the statistical structural analysis difficult. In the present work, X-ray diffraction analysis has been applied for structural investigation of InAs nanowires grown by different techniques. Using various X-ray diffraction geometries, the nanowire systems were investigated in terms of the lattice parameters, phase composition, strains and displacement fields and stacking defects. In particular, realizing grazing incidence diffraction and controlling the penetration depth of X-ray beam, we characterized sample series grown by Au-assisted metal organic phase epitaxy on GaAs [111]B substrate with different growth time. According to the results of SEM and X-ray investigations, a model of the growth process has been proposed. A more detailed analysis was performed on InAs nanowires grown by molecular beam epitaxy (MBE) on

Microplate-compatible total internal reflection fluorescence microscopy for receptor pharmacology

Science.gov (United States)

Chen, Minghan; Zaytseva, Natalya V.; Wu, Qi; Li, Min; Fang, Ye

2013-05-01

We report the use of total internal reflection fluorescence (TIRF) microscopy for analyzing receptor pharmacology and the development of a microplate-compatible TIRF imaging system. Using stably expressed green fluorescence protein tagged β2-adrenergic receptor as the reporter, we found that the activation of different receptors results in distinct kinetic signatures of the TIRF intensity of cells. These TIRF signatures closely resemble the characteristics of their respective label-free dynamic mass redistribution signals in the same cells. This suggests that TIRF in microplate can be used for profiling and screening drugs.

DIRC, the internally reflecting ring imaging Cherenkov detector for BABAR

International Nuclear Information System (INIS)

Adam, I.; Aston, D.

1997-11-01

The DIRC is a new type of Cherenkov imaging device that will be used for the first time in the BABAR detector at the asymmetric B-factory, PEP-II. It is based on total internal reflection and uses long, rectangular bars made from synthetic fused silica as Cherenkov radiator and light guide. The principles of the DIRC ring imaging Cherenkov technique are explained and results from the prototype program are presented. Its choice for the BABAR detector particle identification system is motivated, followed by a discussion of the quartz radiator properties and the detector design

Creating Comic Books in Nigeria: International Reflections on Literacy, Creativity, and Student Engagement

Science.gov (United States)

Bitz, Michael; Emejulu, Obiajulu

2016-01-01

This article is an international reflection on literacy, creativity, and student engagement. The authors collaborated to help Nigerian youths and their teachers develop, design, and share original comic books. By leveraging student engagement for literacy learning, the authors highlighted the crucial role of creativity in the classroom. The…

Initial idea to use optical flats for x-ray fluorescence analysis and recent applications to diffraction studies

International Nuclear Information System (INIS)

Horiuchi, T.

1993-01-01

Described in this work is the initial idea of using an optical flat for X-ray fluorescence analysis based upon studies of anomalous surface reflection (ASR). To develop total-reflection X-ray fluorescence analysis (TXRF) as one of the most powerful tools for microchemical analysis, various experiments such as the micro-determinations of uranium in sea-water, iron in human blood and rare earth elements in hot spring-water were attempted. Furthermore, the physically interesting experiment on Compton scattering under total-reflection conditions was conducted. Recent applications of the total-reflection phenomenon to diffraction studies, i.e. total-reflection X-ray diffraction (TXRD), are also presented. (author)

Total Internal Reflection Fluorescence Microscopy Imaging-Guided Confocal Single-Molecule Fluorescence Spectroscopy

OpenAIRE

Zheng, Desheng; Kaldaras, Leonora; Lu, H. Peter

2013-01-01

We have developed an integrated spectroscopy system combining total internal reflection fluorescence microscopy imaging with confocal single-molecule fluorescence spectroscopy for two-dimensional interfaces. This spectroscopy approach is capable of both multiple molecules simultaneously sampling and in situ confocal fluorescence dynamics analyses of individual molecules of interest. We have demonstrated the calibration with fluorescent microspheres, and carried out single-molecule spectroscop...

Neutron und X-ray diffraction study on the superstructure of a sodium-rich low plagioclase An sub(16.5)

International Nuclear Information System (INIS)

Joswig, W.; Korekawa, M.

1977-01-01

Neutron and X-ray diffraction experiments had been carried out on a sodium-rich low plagioclase Ansub(16.5) from Sultan Hamud, Kenya. In constrast to previous work very weak (g) reflections (satellites) for all reflections Okl, except reflections 001, could be observed. It is shown that the neutron diffraction method is advantageous to study on submicroscopic periodic domain structure as reported here. (orig.) [de

Synchrotron X-ray diffraction measurements of internal stresses during loading of steel-based metal matrix composites reinforced with TiB2 particles

International Nuclear Information System (INIS)

Bacon, D.H.; Edwards, L.; Moffatt, J.E.; Fitzpatrick, M.E.

2011-01-01

Highlights: → Synchrotron X-ray diffraction was used to measure internal stresses in Fe-TiB 2 MMCs. → Samples of the MMCs were loaded to failure in situ in the X-ray beam. → The results show good elastic load transfer from the matrix to the reinforcement. → There is good agreement with the predicted elastic stresses from Eshelby modeling. → During plastic deformation there is increasing load transfer to the reinforcement. - Abstract: High-energy synchrotron X-ray diffraction was used to measure the internal strain evolution in the matrix and reinforcement of steel-based metal matrix composites reinforced with particulate titanium diboride (TiB 2 ). Two systems were studied: a 316L matrix with 25% TiB 2 by volume and a W1.4418 matrix with 10% reinforcement. In situ loading experiments were performed, where the materials were loaded uniaxially in the X-ray beam. The results show the strain partitioning between the phases in the elastic regime, and the evolution of the strain partitioning once plasticity occurs. The results are compared with results from Eshelby modelling, and very good agreement is seen between the measured and modelled response for elastic loading of the material. Heat treatment of the 316-based material did not affect the elastic internal strain response.

Diffraction imaging and velocity analysis using oriented velocity continuation

KAUST Repository

Decker, Luke

2014-08-05

We perform seismic diffraction imaging and velocity analysis by separating diffractions from specular reflections and decomposing them into slope components. We image slope components using extrapolation in migration velocity in time-space-slope coordinates. The extrapolation is described by a convection-type partial differential equation and implemented efficiently in the Fourier domain. Synthetic and field data experiments show that the proposed algorithm is able to detect accurate time-migration velocities by automatically measuring the flatness of events in dip-angle gathers.

Exact solution for the reflection and diffraction of atomic de Broglie waves by a travelling evanescent laser wave

International Nuclear Information System (INIS)

Witte, N.S.

1997-01-01

The exact solution to the problem of reflection and diffraction of atomic de Broglie waves by a travelling evanescent wave is found starting with a bare-state formulation. The solution for the wavefunctions, the tunnelling losses and the non-adiabatic losses are given exactly in terms of hyper-Bessel functions, and are valid for all detuning and Rabi frequencies, thus generalizing previous approximate methods. Furthermore we give the limiting cases of all amplitudes in the uniform semiclassical limit, which is valid in all regions including near the classical turning points, and in the large and weak coupling cases. Exact results for the zero detuning case are obtained in terms of Bessel functions. We find our uniform semiclassical limit to be closer to the exact result over the full range of parameter values than the previously reported calculations. The current knowledge of hyper-Bessel function properties is reviewed in order to apply this to the physical problems imposed

NIST/Sandia/ICDD Electron Diffraction Database: A Database for Phase Identification by Electron Diffraction.

Science.gov (United States)

Carr, M J; Chambers, W F; Melgaard, D; Himes, V L; Stalick, J K; Mighell, A D

1989-01-01

A new database containing crystallographic and chemical information designed especially for application to electron diffraction search/match and related problems has been developed. The new database was derived from two well-established x-ray diffraction databases, the JCPDS Powder Diffraction File and NBS CRYSTAL DATA, and incorporates 2 years of experience with an earlier version. It contains 71,142 entries, with space group and unit cell data for 59,612 of those. Unit cell and space group information were used, where available, to calculate patterns consisting of all allowed reflections with d -spacings greater than 0.8 A for ~ 59,000 of the entries. Calculated patterns are used in the database in preference to experimental x-ray data when both are available, since experimental x-ray data sometimes omits high d -spacing data which falls at low diffraction angles. Intensity data are not given when calculated spacings are used. A search scheme using chemistry and r -spacing (reciprocal d -spacing) has been developed. Other potentially searchable data in this new database include space group, Pearson symbol, unit cell edge lengths, reduced cell edge length, and reduced cell volume. Compound and/or mineral names, formulas, and journal references are included in the output, as well as pointers to corresponding entries in NBS CRYSTAL DATA and the Powder Diffraction File where more complete information may be obtained. Atom positions are not given. Rudimentary search software has been written to implement a chemistry and r -spacing bit map search. With typical data, a full search through ~ 71,000 compounds takes 10~20 seconds on a PDP 11/23-RL02 system.

Symbolic Uses of Evaluation in the International Aid Sector: Arguments for Critical Reflection

Science.gov (United States)

McNulty, James

2012-01-01

Significant progress has been made in recent years to improve the quality of the evaluation of international aid. Increasingly, this includes an interest in improving the way evaluations are used to improve policies and programmes. However, the prevalence of symbolic use--a phenomenon that is often mentioned but rarely studied--reflects an…

Specific Features of Reflection of Information Regarding Lease Operations in the National and International Standards

Directory of Open Access Journals (Sweden)

Nikolenko Nataliya V.

2013-12-01

Full Text Available The article identifies the degree of correspondence of the national Provisions (Standard of Business Accounting (PSBA Lease with the international standard and provides recommendations with respect to their closing up. On the results of the study the author provides specific features of international and national standards – the existing IFRS 17 Lease and national PSBA 14 Lease by the following components: definition of lease, its classification and reflection in accounting. Also the text of PSBA 31 Financial Expenditures is supplemented with provisions on capitalisation of financial expenditures prospectively, which would allow avoidance of correction of the balance of the retained income and provision of comparative information for previous periods. The article provides an algorithm of division of lease for accounting purposes on the basis of international standards. Its use would ensure correctness of reflection of lease operations in accounting and would serve as a basis for development of methodical provisions with respect to accounting. By the result of the study the author forms definition of the qualification asset as an asset which requires considerable time for its creation, preparation for target use, sales or acquisition of the ownership right. Capitalisation of such expenditures would allow non-reduction of the accounting income and also would provide a possibility to reflect financial expenditures in accordance with their economic essence.

Measurements of transient electron density distributions by femtosecond X-ray diffraction

International Nuclear Information System (INIS)

Freyer, Benjamin

2013-01-01

This thesis concerns measurements of transient charge density maps by femtosecond X-ray diffraction. Different X-ray diffraction methods will be considered, particularly with regard to their application in femtosecond X-ray diffraction. The rotation method is commonly used in stationary X-ray diffraction. In the work in hand an X-ray diffraction experiment is demonstrated, which combines the method with ultrafast X-ray pulses. This experiment is the first implementation which makes use of the rotation method to map transient intensities of a multitude of Bragg reflections. As a prototype material Bismuth is used, which previously was studied frequently by femtosecond X-ray diffraction by measuring Bragg reflections successively. The experimental results of the present work are compared with the literature data. In the second part a powder-diffraction experiment will be presented, which is used to study the dynamics of the electron-density distribution on ultrafast time scales. The experiment investigates a transition metal complex after photoexcitation of the metal to ligand charge transfer state. Besides expected results, i. e. the change of the bond length between the metal and the ligand and the transfer of electronic charge from the metal to the ligand, a strong contribution of the anion to the charge transfer was found. Furthermore, the charge transfer has predominantly a cooperative character. That is, the excitation of a single complex causes an alteration of the charge density of several neighboring units. The results show that more than 30 transition-metal complexes and 60 anions contribute to the charge transfer. This collective response is a consequence of the strong coulomb interactions of the densely packed ions.

Beyond ‘Innocents Abroad’: Reflecting on Sustainability Issues During International Study Trips

Directory of Open Access Journals (Sweden)

Anne H. Reilly

2016-12-01

Full Text Available With ecosystems and populations in many regions threatened by rapid development, sustainability is a critical component for businesses in mature markets and emerging economies alike. The International Association of Jesuit Business Schools notes that global sustainability involves a broad set of interconnected issues ranging from environmental preservation to social justice to desirable production and consumption patterns. Jesuit business schools are uniquely positioned to address sustainability issues with their focus on teaching managerial content in tandem with corporate social responsibility. Further, the Ignatian Pedagogy Paradigm of experience, reflection, and action would suggest that business students may benefit from reflective observation in support of learning about sustainability. In this paper, we examine the international study trip as an opportunity for students to learn about sustainability, with results suggesting that student understanding about the broad sustainability domain may be enhanced through the study abroad experience. We discuss how two classes of primarily American MBA students traveling to emerging markets (one class to Santiago, Chile and one class to Johannesburg, South Africa were able to connect local business practices with economic and social as well as environmental sustainability issues, enhancing both student engagement and learning outcomes. Further, these students’ sustainability experiences while in an unfamiliar environment provided the opportunity to apply the potentially transformative experience, reflection, and action components of the Ignatian Pedagogy Paradigm. Compared to similar graduate business students enrolled in regular classes, we argue that these students discerned deeper connections with the economic, social, and environmental issues of sustainability.

Total internal reflection and dynamic light scattering microscopy of gels

Science.gov (United States)

Gregor, Brian F.

Two different techniques which apply optical microscopy in novel ways to the study of biological systems and materials were built and applied to several samples. The first is a system for adapting the well-known technique of dynamic light scattering (DLS) to an optical microscope. This can detect and scatter light from very small volumes, as compared to standard DLS which studies light scattering from volumes 1000x larger. The small scattering volume also allows for the observation of nonergodic dynamics in appropriate samples. Porcine gastric mucin (PGM) forms a gel at low pH which lines the epithelial cell layer and acts as a protective barrier against the acidic stomach environment. The dynamics and microscopic viscosity of PGM at different pH levels is studied using polystyrene microspheres as tracer particles. The microscopic viscosity and microrheological properties of the commercial basement membrane Matrigel are also studied with this instrument. Matrigel is frequently used to culture cells and its properties remain poorly determined. Well-characterized and purely synthetic Matrigel substitutes will need to have the correct rheological and morphological characteristics. The second instrument designed and built is a microscope which uses an interferometry technique to achieve an improvement in resolution 2.5x better in one dimension than the Abbe diffraction limit. The technique is based upon the interference of the evanescent field generated on the surface of a prism by a laser in a total internal reflection geometry. The enhanced resolution is demonstrated with fluorescent samples. Additionally. Raman imaging microscopy is demonstrated using the evanescent field in resonant and non-resonant samples, although attempts at applying the enhanced resolution technique to the Raman images were ultimately unsuccessful. Applications of this instrument include high resolution imaging of cell membranes and macroscopic structures in gels and proteins. Finally, a third

Obtaining local reflectivity at two-way travel time by filtering acoustic reflection data

NARCIS (Netherlands)

Slob, E.C.; Zhang, L.; Wapenaar, C.P.A.; Mihai Popovici, A.; Fomel, S.

2017-01-01

A modified implementation of Marchenko redatuming leads to a filter that removes internal multiples from reflection data. It produces local reflectivity at two-way travel time. The method creates new primary reflections resulting from emitted events that eliminate internal multiples. We call these

Ultrafast molecular imaging by laser-induced electron diffraction

International Nuclear Information System (INIS)

Peters, M.; Nguyen-Dang, T. T.; Cornaggia, C.; Saugout, S.; Charron, E.; Keller, A.; Atabek, O.

2011-01-01

We address the feasibility of imaging geometric and orbital structures of a polyatomic molecule on an attosecond time scale using the laser-induced electron diffraction (LIED) technique. We present numerical results for the highest molecular orbitals of the CO 2 molecule excited by a near-infrared few-cycle laser pulse. The molecular geometry (bond lengths) is determined within 3% of accuracy from a diffraction pattern which also reflects the nodal properties of the initial molecular orbital. Robustness of the structure determination is discussed with respect to vibrational and rotational motions with a complete interpretation of the laser-induced mechanisms.

Determination of continuous complex refractive index dispersion of biotissue based on internal reflection

Science.gov (United States)

Deng, Zhichao; Wang, Jin; Ye, Qing; Sun, Tengqian; Zhou, Wenyuan; Mei, Jianchun; Zhang, Chunping; Tian, Jianguo

2016-01-01

The complex refractive index dispersion (CRID), which contains the information on the refractive index dispersion and extinction coefficient spectra, is an important optical parameter of biotissue. However, it is hard to perform the CRID measurement on biotissues due to their high scattering property. Continuous CRID measurement based on internal reflection (CCRIDM-IR) is introduced. By using a lab-made apparatus, internal reflectance spectra of biotissue samples at multiple incident angles were detected, from which the continuous CRIDs were calculated based on the Fresnel formula. Results showed that in 400- to 750-nm range, hemoglobin solution has complicated dispersion and extinction coefficient spectra, while other biotissues have normal dispersion properties, and their extinction coefficients do not vary much with different wavelengths. The normal dispersion can be accurately described by several coefficients of dispersion equations (Cauchy equation, Cornu equation, and Conrady equation). To our knowledge, this is the first time that the continuous CRID of scattering biotissue over a continuous spectral region is measured, and we hereby have proven that CCRIDM-IR is a good method for continuous CRID research of biotissue.

Intra-Cavity Total Reflection For High Sensitivity Measurement Of Optical Properties

Science.gov (United States)

Pipino, Andrew Charles Rule

1999-11-16

An optical cavity resonator device is provided for conducting sensitive murement of optical absorption by matter in any state with diffraction-limited spatial resolution through utilization of total internal reflection within a high-Q (high quality, low loss) optical cavity. Intracavity total reflection generates an evanescent wave that decays exponentially in space at a point external to the cavity, thereby providing a localized region where absorbing materials can be sensitively probed through alteration of the Q-factor of the otherwise isolated cavity. When a laser pulse is injected into the cavity and passes through the evanescent state, an amplitude loss resulting from absorption is incurred that reduces the lifetime of the pulse in the cavity. By monitoring the decay of the injected pulse, the absorption coefficient of manner within the evanescent wave region is accurately obtained from the decay time measurement.

Mirror and Bragg reflections of neutrons at a nuclear resonance: [Final technical report

International Nuclear Information System (INIS)

Batigun, C.M.; Brugger, R.M.

1987-01-01

These experiments have observed the mirror reflection and Bragg diffraction of neutrons at the energy of a low lying nuclear resonance of 115 In. The reflector was a mirror of In metal with the resonance at 1.457 eV. The mirror reflection for different angles of incidence has been measured and sets of data showing the relative reflectivities have been obtained. For the Bragg diffraction, the crystal was a wafer of InP and several examples of Bragg reflections near 1.455 eV were measured. 4 refs., 12 figs

HIFI - a dedicated HIgh-FIeld diffraction and spectroscopy instrument

International Nuclear Information System (INIS)

Steffens, P.; Enderle, M.; Boehm, M.; Roux, S.

2011-01-01

The outstanding scientific impact of single-crystal neutron diffraction and spectroscopy in steady state vertical magnetic fields up to 15 T (17 T without dilution fringe) is reflected in numerous high-profile publications. Magnetic fields 30 T - 35 T in vertical geometry allow to address enigmatic questions without equivalence at lower fields. The constraints implied by such magnetic fields demand a specially designed dedicated instrument. Since the vertical field geometry is crucial for single-crystal diffraction as well as spectroscopy, the solid angle of scattered neutrons is restricted, and a high-flux reactor is best suited to host a corresponding instrument. We propose a world-wide unique versatile instrument for diffraction and spectroscopy in vertical steady fields of 30 T. (authors)

X-ray grazing incidence diffraction from multilayers

Energy Technology Data Exchange (ETDEWEB)

Tixier, S.; Boeni, P.; Swygenhoven, H. van; Horisberger, M. [Paul Scherrer Inst. (PSI), Villigen (Switzerland)

1997-09-01

Grazing incidence scattering geometries using synchrotron radiation have been applied in order to characterise the roughness profiles and the structural coherence of multilayers. The lateral correlation length of the roughness profiles was evaluated using diffuse reflectivity in the `out of plane` geometry. This type of measurement is the only diffuse reflectivity technique allowing large lateral momentum transfer. It is typically suitable for correlation lengths smaller than 1000 A. The lateral structural coherence length of Ni{sub 3}Al/Ni multilayers as a function of the layer thickness was obtained by grazing incidence diffraction (GID). 3 figs., 1 ref.

All-optical microscope autofocus based on an electrically tunable lens and a totally internally reflected IR laser.

Science.gov (United States)

Bathe-Peters, M; Annibale, P; Lohse, M J

2018-02-05

Microscopic imaging at high spatial-temporal resolution over long time scales (minutes to hours) requires rapid and precise stabilization of the microscope focus. Conventional and commercial autofocus systems are largely based on piezoelectric stages or mechanical objective actuators. Objective to sample distance is either measured by image analysis approaches or by hardware modules measuring the intensity of reflected infrared light. We propose here a truly all-optical microscope autofocus taking advantage of an electrically tunable lens and a totally internally reflected infrared probe beam. We implement a feedback-loop based on the lateral position of a totally internally reflected infrared laser on a quadrant photodetector, as an indicator of the relative defocus. We show here how to treat the combined contributions due to mechanical defocus and deformation of the tunable lens. As a result, the sample can be kept in focus without any mechanical movement, at rates up to hundreds of Hertz. The device requires only reflective optics and can be implemented at a fraction of the cost required for a comparable piezo-based actuator.

Size effect in X-ray and electron diffraction patterns from hydroxyapatite particles

International Nuclear Information System (INIS)

Suvorova, E.I.; Buffat, P.-A.

2001-01-01

High-resolution transmission electron microscopy (HRTEM), electron microdiffraction, and X-ray diffraction were used to study hydroxyapatite specimens with particle sizes from a few nanometers to several hundreds of nanometers. Diffuse scattering (without clear reflections in transmission diffraction patterns) or strongly broadened peaks in X-ray diffraction patterns are characteristic for agglomerated hydroxyapatite nanocrystals. However, HRTEM and microdiffraction showed that this cannot be considered as an indication of the amorphous state of the matter but rather as the demonstration of size effect and the morphological and structural features of hydroxyapatite nanocrystals

REFLECTIONS ON PRODUCTION INTERNALIZATION AND ITS INTERNATIONAL TRADE IMPLICATIONS

Directory of Open Access Journals (Sweden)

CLIPA RALUCA IRINA

2014-06-01

Full Text Available Vertically-integrated multinational companies place the different stages of production and marketing chain in different countries, looking for advantages such as low production costs, lower taxes, abundant resources and so on, while benefiting from the advantages of economies of scale, control of supplies or outlets. In fact, this vertical integration of multinational companies has led to the expansion of intra-firm trade and "internalized" operations, thus creating their own markets for the vertically-integrated production. Internationally active firms operate in a way that replaces the different functions of an open market with internal transactions, i.e. intra-firm transactions, whenever internal transaction costs are lower than the open-market ones. The direct consequence over international trade is the increase of intra-firm share of trade flows to one third of world trade, those companies making a suppression of international market segments that act in favour of an internal market. The creation of a multinational market and the enhancement of intra-firm trade have profound quantitative and qualitative implications on the composition, geographic orientation and dynamics of international trade. This paper deals with the issue of production internalization, with an overview of the main contributions made to the theory of internalization, while tackling its relative dimension. However, we intend to highlight the implications of this phenomenon on international trade. The work methodology falls within the range of qualitative approaches: logical argumentation, critical theoretical analysis.

Synchrotron X-ray diffraction analysis for quantitative defect evaluation in GaP/Si nanolayers

Energy Technology Data Exchange (ETDEWEB)

Nguyen Thanh, T.; Robert, C. [Université Européenne de Bretagne, INSA, FOTON, UMR 6082, F-35708 RENNES (France); Létoublon, A., E-mail: Antoine.letoublon@insa-rennes.fr [Université Européenne de Bretagne, INSA, FOTON, UMR 6082, F-35708 RENNES (France); Cornet, C. [Université Européenne de Bretagne, INSA, FOTON, UMR 6082, F-35708 RENNES (France); Quinci, T. [Université Européenne de Bretagne, INSA, FOTON, UMR 6082, F-35708 RENNES (France); CEA LCP, INES, 50 av. du Lac Léman, Savoie Technolac, 73375 Le Bourget du Lac (France); Giudicelli, E.; Almosni, S. [Université Européenne de Bretagne, INSA, FOTON, UMR 6082, F-35708 RENNES (France); Boudet, N. [CRG-D2AM, ESRF and Inst. Néel, CNRS-UJF, 25 Av des Martyrs, 38042 Grenoble (France); Ponchet, A. [CEMES, CNRS, Université de Toulouse, 29 rue J. Marvig BP 94347, 31055 Toulouse Cedex 4 (France); Kuyyalil, J. [Université Européenne de Bretagne, INSA, FOTON, UMR 6082, F-35708 RENNES (France); Danila, M. [National Institute for Research and Development in Microtechnologies (IMT), 126A Erou Iancu Nicolae Street, 077190, Bucharest (Romania); Durand, O.; Bertru, N.; Le Corre, A. [Université Européenne de Bretagne, INSA, FOTON, UMR 6082, F-35708 RENNES (France)

2013-08-31

In the context of III–V monolithic integration on silicon, synchrotron X-ray diffraction has been employed in this study using a bi-dimensional large area hybrid pixel detector (XPAD third generation) to characterize defects in the GaP layers. Despite a very coherent interface (low plastic relaxation) of GaP/Si, 2 types of defect are detected. Micro-twins contributions are evidenced and quantitatively evaluated from additional reflections analysis. Antiphase domains are evidenced using the Williamson-Hall-like plot method applied to transverse scans extracted directly from single XPAD images taken on specular GaP reflections. - Highlights: ► Antiphase domain evidence and characterization in GaP/Si using X-ray diffraction ► Microtwin evidence and characterization ► Synchrotron diffraction ► Large area X-ray hybrid pixel detector.

Analysis of XFEL serial diffraction data from individual crystalline fibrils

Directory of Open Access Journals (Sweden)

David H. Wojtas

2017-11-01

Full Text Available Serial diffraction data collected at the Linac Coherent Light Source from crystalline amyloid fibrils delivered in a liquid jet show that the fibrils are well oriented in the jet. At low fibril concentrations, diffraction patterns are recorded from single fibrils; these patterns are weak and contain only a few reflections. Methods are developed for determining the orientation of patterns in reciprocal space and merging them in three dimensions. This allows the individual structure amplitudes to be calculated, thus overcoming the limitations of orientation and cylindrical averaging in conventional fibre diffraction analysis. The advantages of this technique should allow structural studies of fibrous systems in biology that are inaccessible using existing techniques.

X ray reflection masks: Manufacturing, characterization and first tests

Science.gov (United States)

Rahn, Stephen

1992-09-01

SXPL (Soft X-ray Projection Lithography) multilayer mirrors are characterized, laterally structured and then used as reflection masks in a projecting lithography procedure. Mo/Si-multilayer mirrors with a 2d in the region of 14 nm were characterized by Cu-k(alpha) grazing incidence as well as soft X-ray normal incidence reflectivity measurements. The multilayer mirrors were patterned by reactive ion etching with CF4 using a photoresist as etch mask, thus producing X-ray reflection masks. The masks were tested at the synchrotron radiation laboratory of the electron accelerator ELSA. A double crystal X-ray monochromator was modified so as to allow about 0.5 sq cm of the reflection mask to be illuminated by white synchrotron radiation. The reflected patterns were projected (with an energy of 100 eV) onto a resist and structure sizes down to 8 micrometers were nicely reproduced. Smaller structures were distorted by Fresnel-diffraction. The theoretically calculated diffraction images agree very well with the observed images.

Big-data reflection high energy electron diffraction analysis for understanding epitaxial film growth processes.

Science.gov (United States)

Vasudevan, Rama K; Tselev, Alexander; Baddorf, Arthur P; Kalinin, Sergei V

2014-10-28

Reflection high energy electron diffraction (RHEED) has by now become a standard tool for in situ monitoring of film growth by pulsed laser deposition and molecular beam epitaxy. Yet despite the widespread adoption and wealth of information in RHEED images, most applications are limited to observing intensity oscillations of the specular spot, and much additional information on growth is discarded. With ease of data acquisition and increased computation speeds, statistical methods to rapidly mine the data set are now feasible. Here, we develop such an approach to the analysis of the fundamental growth processes through multivariate statistical analysis of a RHEED image sequence. This approach is illustrated for growth of La(x)Ca(1-x)MnO(3) films grown on etched (001) SrTiO(3) substrates, but is universal. The multivariate methods including principal component analysis and k-means clustering provide insight into the relevant behaviors, the timing and nature of a disordered to ordered growth change, and highlight statistically significant patterns. Fourier analysis yields the harmonic components of the signal and allows separation of the relevant components and baselines, isolating the asymmetric nature of the step density function and the transmission spots from the imperfect layer-by-layer (LBL) growth. These studies show the promise of big data approaches to obtaining more insight into film properties during and after epitaxial film growth. Furthermore, these studies open the pathway to use forward prediction methods to potentially allow significantly more control over growth process and hence final film quality.

Surface segregation of InGaAs films by the evolution of reflection high-energy electron diffraction patterns

International Nuclear Information System (INIS)

Zhou Xun; Luo Zi-Jiang; Guo Xiang; Zhang Bi-Chan; Shang Lin-Tao; Zhou Qing; Deng Chao-Yong; Ding Zhao

2012-01-01

Surface segregation is studied via the evolution of reflection high-energy electron diffraction (RHEED) patterns under different values of As 4 BEP for InGaAs films. When the As 4 BEP is set to be zero, the RHEED pattern keeps a 4×3/(n × 3) structure with increasing temperature, and surface segregation takes place until 470 °C. The RHEED pattern develops into a metal-rich (4 × 2) structure as temperature increases to 495 °C. The reason for this is that surface segregation makes the In inside the InGaAs film climb to its surface. With the temperature increasing up to 515 °C, the RHEED pattern turns into a GaAs(2 × 4) structure due to In desorption. While the As 4 BEP comes up to a specific value (1.33 × 10 -4 Pa−1.33 × 10 -3 Pa), the surface temperature can delay the segregation and desorption. We find that As 4 BEP has a big influence on surface desorption, while surface segregation is more strongly dependent on temperature than surface desorption. (condensed matter: structural, mechanical, and thermal properties)

Determination of three-dimensional interfacial strain - A novel method of probing interface structure with X-ray Bragg-surface diffraction

International Nuclear Information System (INIS)

Sun, W.-C.; Chu, C.-H.; Chang, H.-C.; Wu, B.-K.; Chen, Y.-R.; Cheng, C.-W.; Chiu, M.-S.; Shen, Y.-C.; Wu, H.-H.; Hung, Y.-S.; Chang, S.-L.; Hong, M.-H.; Tang, M.-T.; Stetsko, Yu.P.

2007-01-01

A new X-ray diffraction technique is developed to probe structural variations at the interfaces between epitaxy thin films and single-crystal substrates. The technique utilizes three-wave Bragg-surface diffraction, where a symmetric Bragg reflection and an asymmetric surface reflection are involved. The propagation of the latter along the interfaces conveys structural information about the interfacial region between the substrate and epi-layers. The sample systems of Au/GaAs(001) are subject to the three-wave diffraction investigation using synchrotron radiation. The GaAs three-wave Bragg-surface diffractions (006)/(11-bar3) and (006)/(1-bar1-bar3), are employed. The images of the surface diffracted waves are recorded with an image plate. The obtained images show relative positions of diffraction spots near the image of the interfacial boundary, which give the variation of lattice constant along the surface normal and in-plane directions. With the aid of grazing-incidence diffraction, three-dimensional mapping of strain field at the interfaces is possible. Details about this diffraction technique and the analysis procedures are discussed

Tolerance analysis on diffraction efficiency and polychromatic integral diffraction efficiency for harmonic diffractive optics

Science.gov (United States)

Shan, Mao

2016-10-01

In this dissertation, the mathematical model of effect of manufacturing errors including microstructure relative height error and relative width error on diffraction efficiency for the harmonic diffractive optical elements (HDEs) is set up. According to the expression of the phase delay and diffraction efficiency of the HDEs, the expression of diffraction efficiency of refraction and diffractive optical element with the microstructure height and periodic width errors in fabrication process is presented in this paper. Furthermore, the effect of manufacturing errors on diffraction efficiency for the harmonic diffractive optical elements is studied, and diffraction efficiency change is analyzed as the relative microstructure height-error in the same and in the opposite sign as well as relative width-error in the same and in the opposite sign. Example including infrared wavelength with materials GE has been discussed in this paper. Two kinds of manufacturing errors applied in 3.7 4.3um middle infrared and 8.7-11.5um far infrared optical system which results in diffraction efficiency and PIDE of HDEs are studied. The analysis results can be used for manufacturing error control in micro-structure height and periodic width. Results can be used for HDEs processing.

Prospect for application of compact accelerator-based neutron source to neutron engineering diffraction

Energy Technology Data Exchange (ETDEWEB)

Ikeda, Yoshimasa, E-mail: yoshimasa.ikeda@riken.jp [Center for Advanced Photonics, RIKEN, Wako, Saitama 351-0198 (Japan); Taketani, Atsushi; Takamura, Masato; Sunaga, Hideyuki [Center for Advanced Photonics, RIKEN, Wako, Saitama 351-0198 (Japan); Kumagai, Masayoshi [Faculty of Engineering, Tokyo City University, Setagaya, Tokyo 158-8857 (Japan); Oba, Yojiro [Research Reactor Institute, Kyoto University, Kumatori, Osaka 590-0494 (Japan); Otake, Yoshie [Center for Advanced Photonics, RIKEN, Wako, Saitama 351-0198 (Japan); Suzuki, Hiroshi [Materials Sciences Research Center, Japan Atomic Energy Agency, Tokai, Ibaraki 319-1195 (Japan)

2016-10-11

A compact accelerator-based neutron source has been lately discussed on engineering applications such as transmission imaging and small angle scattering as well as reflectometry. However, nobody considers using it for neutron diffraction experiment because of its low neutron flux. In this study, therefore, the neutron diffraction experiments are carried out using Riken Accelerator-driven Compact Neutron Source (RANS), to clarify the capability of the compact neutron source for neutron engineering diffraction. The diffraction pattern from a ferritic steel was successfully measured by suitable arrangement of the optical system to reduce the background noise, and it was confirmed that the recognizable diffraction pattern can be measured by a large sampling volume with 10 mm in cubic for an acceptable measurement time, i.e. 10 min. The minimum resolution of the 110 reflection for RANS is approximately 2.5% at 8 μs of the proton pulse width, which is insufficient to perform the strain measurement by neutron diffraction. The moderation time width at the wavelength corresponding to the 110 reflection is estimated to be approximately 30 μs, which is the most dominant factor to determine the resolution. Therefore, refinements of the moderator system to decrease the moderation time by decreasing a thickness of the moderator or by applying the decoupler system or application of the angular dispersive neutron diffraction technique are important to improve the resolution of the diffraction experiment using the compact neutron source. In contrast, the texture evolution due to plastic deformation was successfully observed by measuring a change in the diffraction peak intensity by RANS. Furthermore, the volume fraction of the austenitic phase in the dual phase mock specimen was also successfully evaluated by fitting the diffraction pattern using a Rietveld code. Consequently, RANS has been proved to be capable for neutron engineering diffraction aiming for the easy access

Soft x-ray resonant magnetic powder diffraction on PrNiO{sub 3}

Energy Technology Data Exchange (ETDEWEB)

Staub, U [Swiss Light Source, Paul Scherrer Institut, CH-5232 Villigen PSI (Switzerland); GarcIa-Fernandez, M [Swiss Light Source, Paul Scherrer Institut, CH-5232 Villigen PSI (Switzerland); Mulders, A M [Department of Applied Physics, Curtin University of Technology, GPO Box U1987, Perth WA 6845 (Australia); Bodenthin, Y [Swiss Light Source, Paul Scherrer Institut, CH-5232 Villigen PSI (Switzerland); MartInez-Lope, M J [Instituto de Ciencia de Materiales de Madrid, CSIC, Cantoblanco, E-28049 Madrid (Spain); Alonso, J A [Instituto de Ciencia de Materiales de Madrid, CSIC, Cantoblanco, E-28049 Madrid (Spain)

2007-03-07

We report on the first soft x-ray resonant powder diffraction experiments performed at the Ni L{sub 2,3} edges of PrNiO{sub 3}. The temperature, polarization and energy dependence of the (1/2 0 1/2) reflection indicates a magnetic origin for the signal. This experiment demonstrates that x-ray resonant magnetic powder diffraction can be relatively easily performed in the soft x-ray regime due to the very large enhancement factors at the absorption edges. Such experiments allow us to extract important information on the electronic states of the d shell. Similar results can be anticipated from orbital reflections measured in a powder. (fast track communication)

Variable-angle total internal reflection fluorescence microscopy of intact cells of Arabidopsis thaliana

Directory of Open Access Journals (Sweden)

Kim Myung K

2011-09-01

Full Text Available Abstract Background Total internal reflection fluorescence microscopy (TIRFM is a powerful tool for observing fluorescently labeled molecules on the plasma membrane surface of animal cells. However, the utility of TIRFM in plant cell studies has been limited by the fact that plants have cell walls, thick peripheral layers surrounding the plasma membrane. Recently, a new technique known as variable-angle epifluorescence microscopy (VAEM was developed to circumvent this problem. However, the lack of a detailed analysis of the optical principles underlying VAEM has limited its applications in plant-cell biology. Results Here, we present theoretical and experimental evidence supporting the use of variable-angle TIRFM in observations of intact plant cells. We show that when total internal reflection occurs at the cell wall/cytosol interface with an appropriate angle of incidence, an evanescent wave field of constant depth is produced inside the cytosol. Results of experimental TIRFM observations of the dynamic behaviors of phototropin 1 (a membrane receptor protein and clathrin light chain (a vesicle coat protein support our theoretical analysis. Conclusions These findings demonstrate that variable-angle TIRFM is appropriate for quantitative live imaging of cells in intact tissues of Arabidopsis thaliana.

Neutron magnetic multiple diffraction in a natural magnetite crystal

International Nuclear Information System (INIS)

Mazzocchi, V.L.; Parente, C.B.R.

1988-09-01

Neutron multiple diffraction has been employed in the study of the magnetism in magnetite (Fe 3 O 4 ). Magnetite has a crystallographic structure of an inverted spinel with tetrahedral A sites occupied solely by trivalent Fe 3+ ions and octahedral B sites occupied both by divalent Fe 2+ ions and the remaining Fe 3+ ions in random distribution. At room temperature magnetite is a Neel A-B ferrimagnet where the ions on the A, B sites are coupled antiferromagneticaly. This coupling disappears at T sup c approx. or approx.= 580 0 C. Employing a natural single crystal of magnetite experimental neutron multiple diffraction patterns were obtained for the primary reflection 111 at room temperature and 703 0 C. This reflection is almost entirely magnetic in origin resulting in 'Aufhellung' patterns below T c and mixed 'Aufhellung-Umweganregung' patterns above T c . Theoretical patterns were calculated employing the iterative method for the approximation of intensities by a Taylor series and compared to the experimental results. (author) [pt

Stress measurements by multi-reflection grazing-incidence X-ray diffraction method (MGIXD) using different radiation wavelengths and different incident angles

International Nuclear Information System (INIS)

Marciszko, Marianna; Baczmański, Andrzej; Braham, Chedly; Wróbel, Mirosław; Wroński, Sebastian; Cios, Grzegorz

2017-01-01

The presented study introduces the development of the multi-reflection grazing-incidence X-ray diffraction method (MGIXD) for residual stress determination. The proposed new methodology is aimed at obtaining more reliable experimental data and increasing the depth of non-destructive stress determination below the sample surface. To verify proposed method measurements were performed on a classical X-ray diffractometer (Cu Kα radiation) and using synchrotron radiation (three different wavelengths: λ = 1.2527 Å, λ = 1.5419 Å and λ = 1.7512 Å). The Al2017 alloy subjected to three different surface treatments was investigated in this study. The obtained results showed that the proposed development of MGIXD method, in which not only different incident angles but also different wavelengths of X-ray are used, can be successfully applied for residual stress determination, especially when stress gradients are present in the sample.

The influence of texture on the strain measured by diffraction

International Nuclear Information System (INIS)

Penning, P.; Brakman, C.M.

1988-01-01

Strain, as determined by diffraction techniques, is calculated from its constituents. First, the fraction of the crystals that have the proper orientation for diffraction. One degree of freedom is present: the angle of rotation φ 2 '' about the scattering vector that the diffracting crystals have in common. The proper orientations, expressed in Euler angles, lie on a line ('trace') in orientation space. The density along the trace is asserted to be known as a Fourier series in φ 2 ''. Second, the strain in the diffracting crystals. The simplest possible models are discussed: the Voigt and Reuss approximations. The symmetries of the crystal (m3 or m3m) and of the orientation distribution function (o.d.f.) are taken into account. The dilatation in spacing of the reflecting planes is found as a Fourier series in φ 2 '' also. Only the zeroth, first and second harmonic (including phase angles: five parameters) play a part. The diffraction strain is the average over the angle φ 2 '' of the dilatation, weighted with the product of the orientation density and the square of the structure factor. For each contributing trace, the corresponding Fourier coefficients have to be multiplied and added to obtain the diffraction strain. The symmetry of the diffraction pole figure is derived. (orig.)

Diffraction experiments of argon or helium on polluted surfaces

International Nuclear Information System (INIS)

Berthier, J.P.; Constans, A.; Daury, G.; Lostis, P.

1975-01-01

Scattering patterns of molecular beams of argon or helium from metal surfaces (bulk metal or thin films) are reported. The pressure in the scattering chamber is about 10 -6 torr. So, the surfaces are polluted. Diffraction peaks are observed which can be interpreted very well by assuming that nitrogen, oxygen or carbon atoms are adsorbed of the surface. On the other hand, diffraction peaks from a silicon crystal have been observed which can be reproduced very well by using silicon crystal lattice. These experiments are not interpreted accurately, but show that molecular reflection can be used for some surface studies [fr

Multiple x-ray diffraction applied to the study of crystal impurities

International Nuclear Information System (INIS)

Cardoso, L.P.

1983-06-01

The x-ray multiple diffraction technique is used in the study of impurities concentration and localization in the crystal lattice, implemented with the fundamental observation that the impurities cannot be distributed with the same spatial group symmetry of the crystal. This fact could introduce scattered intensity in the crystal reciprocal lattice forbidden nodes. This effect was effectively observed in multiple diffraction diagrams, where a reinforcement of the scattered intensity in the pure crystal is produced, when choosing conveniently the involved reflections. The reflectivity theory was developed in the kinematic case, which take into account the scattering by the impurities atoms, and the analysis showed that, in the first approximation, the impurities can influence both in the allowed and forbidden positions for the pure crystal. (L.C.J.A.)

Opto-mechanical design and development of a 460mm diffractive transmissive telescope

Science.gov (United States)

Qi, Bo; Wang, Lihua; Cui, Zhangang; Bian, Jiang; Xiang, Sihua; Ma, Haotong; Fan, Bin

2018-01-01

Using lightweight, replicated diffractive optics, we can construct extremely large aperture telescopes in space.The transmissive primary significantly reduces the sensitivities to out of plane motion as compared to reflective systems while reducing the manufacturing time and costs. This paper focuses on the design, fabrication and ground demonstration of a 460mm diffractive transmissive telescope the primary F/# is 6, optical field of view is 0.2° imagine bandwidth is 486nm 656nm.The design method of diffractive optical system was verified, the ability to capture a high-quality image using diffractive telescope collection optics was tested.The results show that the limit resolution is 94lp/mm, the diffractive system has a good imagine performance with broad bandwidths. This technology is particularly promising as a means to achieve extremely large optical primaries from compact, lightweight packages.

Comparison between powder and slices diffraction methods in teeth samples

Energy Technology Data Exchange (ETDEWEB)

Colaco, Marcos V.; Barroso, Regina C. [Universidade do Estado do Rio de Janeiro (IF/UERJ), RJ (Brazil). Inst. de Fisica. Dept. de Fisica Aplicada; Porto, Isabel M. [Universidade Estadual de Campinas (FOP/UNICAMP), Piracicaba, SP (Brazil). Fac. de Odontologia. Dept. de Morfologia; Gerlach, Raquel F. [Universidade de Sao Paulo (FORP/USP), Rieirao Preto, SP (Brazil). Fac. de Odontologia. Dept. de Morfologia, Estomatologia e Fisiologia; Costa, Fanny N. [Coordenacao dos Programas de Pos-Graduacao de Engenharia (LIN/COPPE/UFRJ), RJ (Brazil). Lab. de Instrumentacao Nuclear

2011-07-01

Propose different methods to obtain crystallographic information about biological materials are important since powder method is a nondestructive method. Slices are an approximation of what would be an in vivo analysis. Effects of samples preparation cause differences in scattering profiles compared with powder method. The main inorganic component of bones and teeth is a calcium phosphate mineral whose structure closely resembles hydroxyapatite (HAp). The hexagonal symmetry, however, seems to work well with the powder diffraction data, and the crystal structure of HAp is usually described in space group P63/m. Were analyzed ten third molar teeth. Five teeth were separated in enamel, detin and circumpulpal detin powder and five in slices. All the scattering profile measurements were carried out at the X-ray diffraction beamline (XRD1) at the National Synchrotron Light Laboratory - LNLS, Campinas, Brazil. The LNLS synchrotron light source is composed of a 1.37 GeV electron storage ring, delivering approximately 4x10{sup -1}0 photons/s at 8 keV. A double-crystal Si(111) pre-monochromator, upstream of the beamline, was used to select a small energy bandwidth at 11 keV . Scattering signatures were obtained at intervals of 0.04 deg for angles from 24 deg to 52 deg. The human enamel experimental crystallite size obtained in this work were 30(3)nm (112 reflection) and 30(3)nm (300 reflection). These values were obtained from measurements of powdered enamel. When comparing the slice obtained 58(8)nm (112 reflection) and 37(7)nm (300 reflection) enamel diffraction patterns with those generated by the powder specimens, a few differences emerge. This work shows differences between powder and slices methods, separating characteristics of sample of the method's influence. (author)

Comparison between powder and slices diffraction methods in teeth samples

International Nuclear Information System (INIS)

Colaco, Marcos V.; Barroso, Regina C.; Porto, Isabel M.; Gerlach, Raquel F.; Costa, Fanny N.

2011-01-01

Propose different methods to obtain crystallographic information about biological materials are important since powder method is a nondestructive method. Slices are an approximation of what would be an in vivo analysis. Effects of samples preparation cause differences in scattering profiles compared with powder method. The main inorganic component of bones and teeth is a calcium phosphate mineral whose structure closely resembles hydroxyapatite (HAp). The hexagonal symmetry, however, seems to work well with the powder diffraction data, and the crystal structure of HAp is usually described in space group P63/m. Were analyzed ten third molar teeth. Five teeth were separated in enamel, detin and circumpulpal detin powder and five in slices. All the scattering profile measurements were carried out at the X-ray diffraction beamline (XRD1) at the National Synchrotron Light Laboratory - LNLS, Campinas, Brazil. The LNLS synchrotron light source is composed of a 1.37 GeV electron storage ring, delivering approximately 4x10 -1 0 photons/s at 8 keV. A double-crystal Si(111) pre-monochromator, upstream of the beamline, was used to select a small energy bandwidth at 11 keV . Scattering signatures were obtained at intervals of 0.04 deg for angles from 24 deg to 52 deg. The human enamel experimental crystallite size obtained in this work were 30(3)nm (112 reflection) and 30(3)nm (300 reflection). These values were obtained from measurements of powdered enamel. When comparing the slice obtained 58(8)nm (112 reflection) and 37(7)nm (300 reflection) enamel diffraction patterns with those generated by the powder specimens, a few differences emerge. This work shows differences between powder and slices methods, separating characteristics of sample of the method's influence. (author)

X-ray diffraction of mineralogical composition of mudstones from eastern Gadaref area, Sudan

International Nuclear Information System (INIS)

Karimeldin, Yassin Ahmed A.

1996-09-01

This study reviews the theoretical and experimental aspects of X-ray diffraction (XRD) technique. Moreover, the mineralogical composition of some mudstones from Gadarif region has been investigated using DIFFRAC-AT software package, by means of searching and matching procedure in the standard XRD patterns edited by International Center for Diffraction Data (ICDD). The X-ray diffraction analysis of the Gadarif mudstones revealed that quartz, kaolinite and tridymite are the major mineral constitutes of these rocks. Whereas other minerals like alunite, coalingate, cristabolite, gutsvechite, hematite, meta-alungen, minamite, monteponite, samarskite, chlorie, illite and smectite represent minor constituents in some samples. Most of the mudstone samples investigated have kaolinite content between 71-100%. This most properly indicates that these rocks were subjected to intense weathering and leaching under warm humid climate. These conditions seems to be less favourable for the formation of clay minerals chlorite, illite and smectite. Generally, the clay mineral types, abundances and distribution appear to be influenced mainly by source rock geology, local environment and climate. Moreover, the high silica content of mudstones reflects the influence of both hydrothermal and weathering process. The high haolinite of these mudstone might suggest a good potential for economic exploitation of the kaoline deposits. Further studies, however, might be needed to investigate other technical properties. Suggestions for further work by XRD are given, and include further additions to the refinement procedures and the purchasing of new computer facilities.(Author)

Exploiting total internal reflection geometry for efficient optical modulation of terahertz light

Directory of Open Access Journals (Sweden)

Xudong Liu

2016-10-01

Full Text Available Efficient methods to modulate terahertz (THz light are essential for realizing rapid THz imaging and communication applications. Here we report a novel THz modulator which utilizes the evanescent wave in a total internal reflection setup coupled with a conductive interface to enhance the attenuation efficiency of THz light. This approach makes it possible to achieve close to 100% modulation with a small interface conductivity of 12 mS. The frequency dependence of this technique is linked to the optical properties of the materials: a material with close to frequency independent conductivity that is also controllable will result in an achromatic modulation response, and the device performance can be optimized further by tuning the internal reflection angle. In this work, we focus on applying the technique in the terahertz frequency range. Using an LED array with a pump intensity of 475 mW/cm2 to produce carriers in a silicon wafer, we have achieved a modulation depth of up to 99.9% in a broad frequency range of 0.1 THz–0.8 THz. The required pumping power for the generation of the required free carriers is low because the sheet conductivity needed is far less than required for traditional transmission techniques. Consequently, the device can be modulated by an LED making it a very practical, low cost, and scalable solution for THz modulation.

Workshop on industrial application of neutron diffraction. Stress measurement by neutron diffraction

CERN Document Server

Minakawa, N; Morii, Y; Oyama, Y

2002-01-01

This workshop was planned to make use of the neutron from the reactor and the pulse neutron source JSNS for the industrial world. Especially, this workshop focused on the stress measurement by the neutron diffraction and it was held on the Tokai JAERI from October 15 to 16, 2001. The participant total was 93 and 40 participated from the industrial world. The introduction of the residual stress development of measurement technique by the neutron diffraction method and a research of the measurement of the residual stress such as the nuclear reactor material, the ordinary structure material, the composite material, the quenching steel, the high strength material were presented and discussed in this workshop. Moreover, it was introduced for the industrial world that an internal stress measurement is important for development of new product or an improvement of a manufacturing process. The question from the industrial world about which can be measured the product form, the size, the measurement precision, the reso...

X-ray diffraction and X-ray standing-wave study of the lead stearate film structure

Energy Technology Data Exchange (ETDEWEB)

Blagov, A. E.; Dyakova, Yu. A.; Kovalchuk, M. V.; Kohn, V. G.; Marchenkova, M. A.; Pisarevskiy, Yu. V.; Prosekov, P. A., E-mail: prosekov@crys.ras.ru [Russian Academy of Sciences, Shubnikov Institute of Crystallography (Russian Federation)

2016-05-15

A new approach to the study of the structural quality of crystals is proposed. It is based on the use of X-ray standing-wave method without measuring secondary processes and considers the multiwave interaction of diffraction reflections corresponding to different harmonics of the same crystallographic reflection. A theory of multiwave X-ray diffraction is developed to calculate the rocking curves in the X-ray diffraction scheme under consideration for a long-period quasi-one-dimensional crystal. This phase-sensitive method is used to study the structure of a multilayer lead stearate film on a silicon substrate. Some specific structural features are revealed for the surface layer of the thin film, which are most likely due to the tilt of the upper layer molecules with respect to the external normal to the film surface.

Neutron diffraction on a large block mosaic crystal

International Nuclear Information System (INIS)

Kim Chir Sen; Nitts, V.V.

1985-01-01

The neutron diffraction by the mosaic single crystal with size of crystallites sufficient to achieve the primary extinction saturation is considered. Two cases where the proportionality between the reflection intensity and the structure amplitude is performed are analysed. Such a dependence is convenient for structure investigations. The difficulties connected with the accounting of the extinction are eliminated considerably

Accessing the diffracted wavefield by coherent subtraction

Science.gov (United States)

Schwarz, Benjamin; Gajewski, Dirk

2017-10-01

Diffractions have unique properties which are still rarely exploited in common practice. Aside from containing subwavelength information on the scattering geometry or indicating small-scale structural complexity, they provide superior illumination compared to reflections. While diffraction occurs arguably on all scales and in most realistic media, the respective signatures typically have low amplitudes and are likely to be masked by more prominent wavefield components. It has been widely observed that automated stacking acts as a directional filter favouring the most coherent arrivals. In contrast to other works, which commonly aim at steering the summation operator towards fainter contributions, we utilize this directional selection to coherently approximate the most dominant arrivals and subtract them from the data. Supported by additional filter functions which can be derived from wave front attributes gained during the stacking procedure, this strategy allows for a fully data-driven recovery of faint diffractions and makes them accessible for further processing. A complex single-channel field data example recorded in the Aegean sea near Santorini illustrates that the diffracted background wavefield is surprisingly rich and despite the absence of a high channel count can still be detected and characterized, suggesting a variety of applications in industry and academia.

A standardless method of quantitative ceramic analysis using X-ray powder diffraction

International Nuclear Information System (INIS)

Mazumdar, S.

1999-01-01

A new procedure using X-ray powder diffraction data for quantitative estimation of the crystalline as well as the amorphous phase in ceramics is described. Classification of the crystalline and amorphous X-ray scattering was achieved by comparison of the slopes at two successive points of the powder pattern at scattering angles at which the crystalline and amorphous phases superimpose. If the second slope exceeds the first by a stipulated value, the intensity is taken as crystalline; otherwise the scattering is considered as amorphous. Crystalline phase analysis is obtained by linear programming techniques using the concept that each observed X-ray diffraction peak has contributions from n component phases, the proportionate analysis of which is required. The method does not require the measurement of calibration data for use as an internal standard, but knowledge of the approximate crystal structure of each phase of interest in the mixture is necessary. The technique is also helpful in qualitative analysis because each suspected phase is characterized by the probability that it will be present when a reflection zone is considered in which the suspected crystalline phase could contribute. The amorphous phases are determined prior to the crystalline ones. The method is applied to ceramic materials and some results are presented. (orig.)

An In-situ method for the study of strain broadening usingsynchrotronx-ray diffraction

Energy Technology Data Exchange (ETDEWEB)

Tang, Chiu C.; Lynch, Peter A.; Cheary, Robert W.; Clark, Simon M.

2006-12-15

A tensonometer for stretching metal foils has beenconstructed for the study of strain broadening in x-ray diffraction lineprofiles. This device, which is designed for use on the powderdiffractometer in Station 2.3 at Daresbury Laboratory, allows in-situmeasurements to be performed on samples under stress. It can be used fordata collection in either transmission or reflection modes using eithersymmetric or asymmetric diffraction geometries. As a test case,measurements were carried out on a 18mum thick copper foil experiencingstrain levels of up to 5 percent using both symmetric reflection andsymmetric transmission diffraction. All the diffraction profilesdisplayed peak broadening and asymmetry which increased with strain. Themeasured profiles were analysed by the fundamental parameters approachusing the TOPAS peak fitting software. All the observed broadenedprofiles were modelled by convoluting a refineable diffraction profile,representing the dislocation and crystallite size broadening, with afixed instrumental profile pre-determined usinghigh quality LaB6reference powder. The de-convolution process yielded "pure" sampleintegral breadths and asymmetry results which displayed a strongdependence on applied strain and increased almost linearly with appliedstrain. Assuming crystallite size broadening in combination withdislocation broadening arising from fcc a/2<110>111 dislocations,we have extracted the variation of mechanic al property with strain. Theobservation of both peak asymmetry and broadening has been interpreted asa manifestation of a cellular structure with cell walls and cellinteriors possessing high and low dislocation densities.

Diffractive interference optical analyzer (DiOPTER)

Science.gov (United States)

Sasikumar, Harish; Prasad, Vishnu; Pal, Parama; Varma, Manoj M.

2016-03-01

This report demonstrates a method for high-resolution refractometric measurements using, what we have termed as, a Diffractive Interference Optical Analyzer (DiOpter). The setup consists of a laser, polarizer, a transparent diffraction grating and Si-photodetectors. The sensor is based on the differential response of diffracted orders to bulk refractive index changes. In these setups, the differential read-out of the diffracted orders suppresses signal drifts and enables time-resolved determination of refractive index changes in the sample cell. A remarkable feature of this device is that under appropriate conditions, the measurement sensitivity of the sensor can be enhanced by more than two orders of magnitude due to interference between multiply reflected diffracted orders. A noise-equivalent limit of detection (LoD) of 6x10-7 RIU was achieved in glass. This work focuses on devices with integrated sample well, made on low-cost PDMS. As the detection methodology is experimentally straightforward, it can be used across a wide array of applications, ranging from detecting changes in surface adsorbates via binding reactions to estimating refractive index (and hence concentration) variations in bulk samples. An exciting prospect of this technique is the potential integration of this device to smartphones using a simple interface based on transmission mode configuration. In a transmission configuration, we were able to achieve an LoD of 4x10-4 RIU which is sufficient to explore several applications in food quality testing and related fields. We are envisioning the future of this platform as a personal handheld optical analyzer for applications ranging from environmental sensing to healthcare and quality testing of food products.

Diffraction gauging

International Nuclear Information System (INIS)

Wilkens, P.H.

1978-01-01

This system of gauging is now being designed to fit on an Excello NC lathe to measure the form, accuracy, and size of external contoured surfaces as they approach the finish machined size. A template profile of the finished workpiece, but 0.003 in. bigger on radius, will be aligned with the workpiece using a reference diameter and face on the machining fixture to leave a gap between the profile of the template and workpiece. A helium--neon laser beam will be projected through this gap using a rotating retroreflector and a fixed laser. The resulting diffraction pattern produced by the laser beam passing through the template to workpiece gap will be reflected and focused on a fixed diode array via a second retroreflector which moves and remains in optical alignment with the first. These retroreflectors will be rotated about a center that will enable the laser beam, which is shaped in a long slit, to scan the template workpiece gap from the pole to the equator of the workpiece. The characteristic diffraction pattern will be detected by the fixed diode array, and the signal levels from this array will be processed in a mini-computer programmed to produce a best fit through the two minima of the diode signals. The separation of the two minima will yield the size of the workpiece to template gap and this information will be presented to the machine tool operator

Application of holographic sub-wavelength diffraction gratings for monitoring of kinetics of bioprocesses

International Nuclear Information System (INIS)

Tamulevičius, Tomas; Šeperys, Rimas; Andrulevičius, Mindaugas; Kopustinskas, Vitoldas; Meškinis, Šarūnas; Tamulevičius, Sigitas; Mikalayeva, Valeryia; Daugelavičius, Rimantas

2012-01-01

Highlights: ► Refractive index sensor based on DLC holographic sub-wavelength period grating. ► Spectroscopic analysis of polarized white light reflected from the grating. ► Control of critical wavelength shift and reflectivity changes. ► Testing of model liquid analyte materials. ► Evaluation of interaction between B. subtilis cells and lysozyme. - Abstract: In this work we present a refractive index (RI) sensor based on a sub-wavelength holographic diffraction grating. The sensor chip was fabricated by dry etching of the finely spaced (d = 428 nm) diffraction grating in SiO x doped diamond like carbon (DLC) film. It is shown that employing a fabricated sensor chip, and using the proposed method of analysis of data, one can inspect kinetics of processes in liquids occurring in the vicinity of the grating surface. The method is based on the spectral composition analysis of polarized polychromatic light reflected from the sub-wavelength diffraction grating. The RI measurement system was tested with different model liquid analytes including 25 wt.%, 50 wt.% sugar water solutions, 10 °C, 50 °C distilled water, also Gram-positive bacteria Bacillus subtilis interaction with ion-permeable channels forming antibiotic gramicidin D and a murolytic enzyme lysozyme. Analysis of the data set of specular reflection spectra enabled us to follow the kinetics of the RI changes in the analyte with millisecond resolution. Detectable changes in the effective RI were not worse than Δn = 10 −4 .

3-D Printed Anti-Reflection Structures for the Terahertz Region

Science.gov (United States)

Bomba, Jarosław; Suszek, Jarosław; Makowski, Michał; Sobczyk, Artur; Sypek, Maciej

2018-01-01

Terahertz radiation has a growing number of applications in material characterization, where spectral fingerprinting and diffractive effects are the carriers of information. On the other hand, electromagnetic waves in the range of millimeters exhibit strong unwanted specular reflections, resulting in uncontrolled interferences. This problem is especially disturbing in the goniometric time-domain spectroscopy (TDS) configuration, where angular distribution of the field modified by the sample is altered by unwanted reflections. For this reason, low-cost anti-reflection layers are desired. Here, we present a simple way of designing and manufacturing one-sided and two-sided anti-reflection polyamide layers for the THz range. The structures were fabricated using 3-D printers based on selective laser sintering. We demonstrate experimentally in the goniometric time-domain spectroscopy the significant reduction of wavelength-dependent oscillations in Fabry-Perot configuration in the range between 0.1 and 0.3 THz. We also examine the influence of the anti-reflection layers on the distribution of THz energy in reflected, transmitted, and diffracted fields.

Small area analysis using micro-diffraction techniques

International Nuclear Information System (INIS)

Goehner, Raymond P.; Tissot, Ralph G. Jr.; Michael, Joseph R.

2000-01-01

An overall trend toward smaller electronic packages and devices makes it increasingly important and difficult to obtain meaningful diffraction information from small areas. X-ray micro-diffraction, electron back-scattered diffraction (EBSD) and Kossel are micro-diffraction techniques used for crystallographic analysis including texture, phase identification and strain measurements. X-ray micro-diffraction primarily is used for phase analysis and residual strain measurements. X-ray micro-diffraction primarily is used for phase analysis and residual strain measurements of areas between 10 microm to 100 microm. For areas this small glass capillary optics are used for producing a usable collimated x-ray beam. These optics are designed to reflect x-rays below the critical angle therefore allowing for larger solid acceptance angle at the x-ray source resulting in brighter smaller x-ray beams. The determination of residual strain using micro-diffraction techniques is very important to the semiconductor industry. Residual stresses have caused voiding of the interconnect metal which then destroys electrical continuity. Being able to determine the residual stress helps industry to predict failures from the aging effects of interconnects due to this stress voiding. Stress measurements would be impossible using a conventional x-ray diffractometer; however, utilizing a 30 microm glass capillary these small areas are readily assessable for analysis. Kossel produces a wide angle diffraction pattern from fluorescent x-rays generated in the sample by an e-beam in a SEM. This technique can yield very precise lattice parameters for determining strain. Fig. 2 shows a Kossel pattern from a Ni specimen. Phase analysis on small areas is also possible using an energy dispersive spectrometer (EBSD) and x-ray micro-diffraction techniques. EBSD has the advantage of allowing the user to observe the area of interest using the excellent imaging capabilities of the SEM. An EDS detector has been

Three-dimensional diffraction of a thin metallic cylinder illuminated in conical incidence: application to diameter estimation

International Nuclear Information System (INIS)

Miguel Sanchez-Brea, Luis; Javier Salgado-Remacha, Francisco

2008-01-01

We present a model to determine the far-field diffraction pattern of a metallic cylinder of infinite length when it is illuminated in oblique incidence. This model is based on the Helmholtz-Kirchhoff integral using the Beckmann conditions for reflection. It considers the three-dimensional nature of the diffracting object as well as the material of which the cylinder is made. This model shows that the diffraction orders are placed in a cone of light. The amplitude at the far field can be divided into three terms: the first term accounts for Babinet's principle, that is, the contribution of the cylinder projection; the second term accounts for the three dimensionality of the cylinder; and the third term accounts for the material of which the cylinder is made. This model is applied to the diameter estimation of the cylinder. Since the amplitude of the Babinet contribution is much larger than the light reflected by the surface, the cylinder diameter can be obtained in a simple way. With this approximation, the locations of the diffraction minima do not vary when the cylinder is inclined. On the other hand, when the reflected light is considered the location of the minima and, hence, the estimation of the diameter, varies. Also, a modification of the diffraction minima is produced by the material of which the cylinder is made. Experimental results are also obtained that corroborate the theoretical approach

Time-domain Brillouin scattering assisted by diffraction gratings

Science.gov (United States)

Matsuda, Osamu; Pezeril, Thomas; Chaban, Ievgeniia; Fujita, Kentaro; Gusev, Vitalyi

2018-02-01

Absorption of ultrashort laser pulses in a metallic grating deposited on a transparent sample launches coherent compression/dilatation acoustic pulses in directions of different orders of acoustic diffraction. Their propagation is detected by delayed laser pulses, which are also diffracted by the metallic grating, through the measurement of the transient intensity change of the first-order diffracted light. The obtained data contain multiple frequency components, which are interpreted by considering all possible angles for the Brillouin scattering of light achieved through multiplexing of the propagation directions of light and coherent sound by the metallic grating. The emitted acoustic field can be equivalently presented as a superposition of plane inhomogeneous acoustic waves, which constitute an acoustic diffraction grating for the probe light. Thus the obtained results can also be interpreted as a consequence of probe light diffraction by both metallic and acoustic gratings. The realized scheme of time-domain Brillouin scattering with metallic gratings operating in reflection mode provides access to wide range of acoustic frequencies from minimal to maximal possible values in a single experimental optical configuration for the directions of probe light incidence and scattered light detection. This is achieved by monitoring the backward and forward Brillouin scattering processes in parallel. Potential applications include measurements of the acoustic dispersion, simultaneous determination of sound velocity and optical refractive index, and evaluation of samples with a single direction of possible optical access.

Fusion bonding of Si wafers investigated by x ray diffraction

DEFF Research Database (Denmark)

Weichel, Steen; Grey, Francois; Rasmussen, Kurt

2000-01-01

The interface structure of bonded Si(001) wafers with twist angle 6.5 degrees is studied as a function of annealing temperature. An ordered structure is observed in x-ray diffraction by monitoring a satellite reflection due to the periodic modulation near the interface, which results from...

Meaning, Internalization, and Externalization: Toward a Fuller Understanding of the Process of Reflection and Its Role in the Construction of the Self

Science.gov (United States)

Le Cornu, Alison

2009-01-01

The study of the process of reflection has a dignified history. However, few have linked reflection to the development of the self in such a way that the form of reflection is understood to influence the resultant type of self. This article explores the process of reflection using a framework of meaning making, internalization, and externalization…

Quantitative determination of phases by X-ray diffraction

International Nuclear Information System (INIS)

Azevedo, A.L.T.

1979-01-01

The internal standard method for the quantitative determination of phases by X-ray diffraction is presented. The method is applicable to multi-phase materials which may be treated as powder. A discussion on sample preparation and some examples follow. (Author) [pt

New focus for elastic and diffractive scattering

International Nuclear Information System (INIS)

Kwiecinski, J.

1995-01-01

A regular feature of the international physics calendar is the International Conference on Elastic and Diffractive Scattering, known also as the Blois Workshops, after their 1985 birthplace in France. The content of this year's meeting embraced a broad spectrum of problems ranging from the classical analysis of elastic scattering and total cross-sections to the ''hard'' or deep inelastic phenomena which test the underlying quark-gluon structure of hadrons. These meetings have traditionally concentrated on broad questions of elastic and diffractive scattering, however the shift of emphasis in physics is now reflected at Blois by interest in the wide range of 'soft' hadronic processes which dominate reaction cross-sections. On the traditional side, a substantial part of the conference was devoted to analysis of forward scattering parameters like total cross-sections, real parts etc, using dispersion relations and fundamental asymptotic theorems which bound the possible growth of those parameters with energy. The present experimental situation in this field was summarized by S. Pruss, followed by theoretical presentations by B. Nicolescu, A. Donnachie, T.T. Wu, A. Martin and others. The data for proton-proton and proton-antiproton scattering seem to support dominance of the 'crossing-even' part of the scattering amplitude (which contributes equally to both proton-proton and protonantiproton scattering), with little evidence for a substantial 'odderon' term which contributes with opposite sign in the two cases. The 'pomeron' physics of high energy behaviour was a central feature of the conference. The experimental data seem to suggest that behaviour with increasing energy depends on the magnitude of the scale which characterizes the process - i.e. whether the process is ''soft'' or ''hard''. Hard processes, in general, show a much more rapid increase with increasing

Detailed Analysis of Amplitude and Slope Diffraction Coefficients for knife-edge structure in S-UTD-CH Model

Directory of Open Access Journals (Sweden)

Eray Arik

2017-03-01

Full Text Available In urban, rural and indoor applications, diffraction mechanism is very important to predict the field strength and calculate the coverage accurately. The diffraction mechanism takes place on NLOS (non-line-of-sight cases like rooftop, vertex, corner, edge and sharp surfaces. S-UTD-CH model computes three type of electromagnetic wave incidence such as direct, reflected and diffracted waves, respectively. As obstacles in diffraction geometry are in the same or closer height, contribution of the diffraction mechanism is dominant. To predict the diffracted fields accurately, amplitude and slope diffraction coefficients and the derivative of these coefficients have to be taken correctly. In this paper, all the derivations about diffraction coefficients are made for knife edge type structures and extensive simulations are performed in order to analyze the amplitude and diffraction coefficients. In plane angle diffraction, contributions of amplitude and slope diffraction coefficient are maxima.

Analysis of X-band radar images for the detection of the reflected and diffracted waves in coastal zones

Science.gov (United States)

Ludeno, Giovanni; Natale, Antonio; Soldovieri, Francesco; Vicinanza, Diego; Serafino, Francesco

2014-05-01

The observation of nearshore waves and the knowledge of the sea state parameters can play a crucial role for the safety of harbors and ocean engineering. In the last two decades, different algorithms for the estimation of sea state parameters, surface currents and bathymetry from X-band radar data have been developed and validated [1, 2]. The retrieval of ocean wave parameters such as significant height, period, direction and wavelength of the dominant wave is based on the spectral analysis of data sequences collected by nautical X-band radars [3]. In particular, the reconstruction of the wave motion is carried out through the inversion procedure explained in [1-3], which exploits the dispersion relationship to define a band pass filter used to separate the energy associated with the ocean waves from the background noise. It is worth to note that the shape of such a band pass filter depends upon the value of both the surface currents and bathymetry; in our reconstruction algorithm these parameters are estimated through the (Normalized Scalar Product) procedure [1], which outperforms other existing methods (e.g., the Least Squares) [4]. From the reconstructed wave elevation sequences we can get the directional spectrum that provides useful information (i.e., wavelength, period, direction and amplitude) relevant to the main waves contributing to the wave motion. Of course, in coastal zones a number of diffraction and reflection phenomena can be observed, due to sea-waves impinging obstacles as jetties, breakwaters and boats. In the present paper we want to show the capability to detect reflected and diffracted sea-waves offered by the processing of X-band radar data. Further details relevant to the obtained results will be provided in the full paper and at the conference time. References [1] F. Serafino, C. Lugni, F. Soldovieri, "A novel strategy for the surface current determination from marine X-Band radar data", IEEE Geosci. and Remote Sensing Letters, vol. 7, no

Application of holographic sub-wavelength diffraction gratings for monitoring of kinetics of bioprocesses

Energy Technology Data Exchange (ETDEWEB)

Tamulevicius, Tomas, E-mail: tomas.tamulevicius@ktu.lt [Institute of Materials Science of Kaunas University of Technology, Savanoriu Ave. 271, LT-50131, Kaunas (Lithuania); Seperys, Rimas; Andrulevicius, Mindaugas; Kopustinskas, Vitoldas; Meskinis, Sarunas; Tamulevicius, Sigitas [Institute of Materials Science of Kaunas University of Technology, Savanoriu Ave. 271, LT-50131, Kaunas (Lithuania); Mikalayeva, Valeryia; Daugelavicius, Rimantas [Department of Biochemistry and Biotechnologies of Vytautas Magnus University, Vileikos St. 8, LT-44404 Kaunas (Lithuania)

2012-09-15

Highlights: Black-Right-Pointing-Pointer Refractive index sensor based on DLC holographic sub-wavelength period grating. Black-Right-Pointing-Pointer Spectroscopic analysis of polarized white light reflected from the grating. Black-Right-Pointing-Pointer Control of critical wavelength shift and reflectivity changes. Black-Right-Pointing-Pointer Testing of model liquid analyte materials. Black-Right-Pointing-Pointer Evaluation of interaction between B. subtilis cells and lysozyme. - Abstract: In this work we present a refractive index (RI) sensor based on a sub-wavelength holographic diffraction grating. The sensor chip was fabricated by dry etching of the finely spaced (d = 428 nm) diffraction grating in SiO{sub x} doped diamond like carbon (DLC) film. It is shown that employing a fabricated sensor chip, and using the proposed method of analysis of data, one can inspect kinetics of processes in liquids occurring in the vicinity of the grating surface. The method is based on the spectral composition analysis of polarized polychromatic light reflected from the sub-wavelength diffraction grating. The RI measurement system was tested with different model liquid analytes including 25 wt.%, 50 wt.% sugar water solutions, 10 Degree-Sign C, 50 Degree-Sign C distilled water, also Gram-positive bacteria Bacillus subtilis interaction with ion-permeable channels forming antibiotic gramicidin D and a murolytic enzyme lysozyme. Analysis of the data set of specular reflection spectra enabled us to follow the kinetics of the RI changes in the analyte with millisecond resolution. Detectable changes in the effective RI were not worse than {Delta}n = 10{sup -4}.

Positronium reflection and positronium beams

International Nuclear Information System (INIS)

Weber, M.; Tang, S.; Khatri, R.; Roellig, L.O.; Viescas, A.J.; Berko, S.; Canter, K.F.; Lynn, K.G.; Mills, A.P. Jr.

1989-01-01

We have observed specular reflection of positronium, Ps, and established that there is adequate intensity at higher energies to make further study worthwhile. The scattering appears to be restricted to the outermost surface with a mean free path of (0.75 ± 0.15)Angstrom for Ps in LiF(100). With a greater intensity Ps beam one should see higher order diffraction beams as the result of the periodicity of the surface. Ps diffraction thus offers the possibility of being a novel and valuable probe to study the outermost surface and to study adsorbents on it. Two methods for producing Ps beams are described. 29 refs., 11 figs

Powder diffraction from a continuous microjet of submicrometer protein crystals.

Science.gov (United States)

Shapiro, D A; Chapman, H N; Deponte, D; Doak, R B; Fromme, P; Hembree, G; Hunter, M; Marchesini, S; Schmidt, K; Spence, J; Starodub, D; Weierstall, U

2008-11-01

Atomic-resolution structures from small proteins have recently been determined from high-quality powder diffraction patterns using a combination of stereochemical restraints and Rietveld refinement [Von Dreele (2007), J. Appl. Cryst. 40, 133-143; Margiolaki et al. (2007), J. Am. Chem. Soc. 129, 11865-11871]. While powder diffraction data have been obtained from batch samples of small crystal-suspensions, which are exposed to X-rays for long periods of time and undergo significant radiation damage, the proof-of-concept that protein powder diffraction data from nanocrystals of a membrane protein can be obtained using a continuous microjet is shown. This flow-focusing aerojet has been developed to deliver a solution of hydrated protein nanocrystals to an X-ray beam for diffraction analysis. This method requires neither the crushing of larger polycrystalline samples nor any techniques to avoid radiation damage such as cryocooling. Apparatus to record protein powder diffraction in this manner has been commissioned, and in this paper the first powder diffraction patterns from a membrane protein, photosystem I, with crystallite sizes of less than 500 nm are presented. These preliminary patterns show the lowest-order reflections, which agree quantitatively with theoretical calculations of the powder profile. The results also serve to test our aerojet injector system, with future application to femtosecond diffraction in free-electron X-ray laser schemes, and for serial crystallography using a single-file beam of aligned hydrated molecules.

Three-dimensional visualization of a human chromosome using coherent x-ray diffraction

International Nuclear Information System (INIS)

Nishino, Yoshinori; Ishikawa, Tetsuya; Takahashi, Yukio; Imamoto, Naoko; Maeshima, Kazuhiro

2010-01-01

We succeeded in observing a human chromosome in two- and three-dimensions using x-ray diffraction microscopy. X-ray diffraction microscopy is a lens-less imaging technique utilizing coherent x-ray diffraction, and can overcome various limitations in conventional lens-based x-ray microscopy. Biological applications of the method have been limited to 2D observation, and 3D observation has been long waited. We found that the reconstructed chromosome images contain high-density axial structure, which has not been observed under unstained or unlabeled conditions. The result experimentally demonstrates the effectiveness of x-ray diffraction microscopy in observing internal structures of unstained biological samples with high image contrast. (author)

Exact solution of the Takagi-Taupin equation for dynamical X-ray Bragg diffraction by a crystal with a transition layer

International Nuclear Information System (INIS)

Chukhovskii, F.N.; Khapachev, Yu. P.

1985-01-01

The general problem of dynamical diffraction on a crystal with a transition layer is theoretically considered. It is shown that the problem of dynamical diffraction on such a crystal can be solved analytically. Special attention is paid to the dependence of the curves of diffractional reflection on the parameters of the transition layer. (author)

Three-dimensional rotation electron diffraction: software RED for automated data collection and data processing.

Science.gov (United States)

Wan, Wei; Sun, Junliang; Su, Jie; Hovmöller, Sven; Zou, Xiaodong

2013-12-01

Implementation of a computer program package for automated collection and processing of rotation electron diffraction (RED) data is described. The software package contains two computer programs: RED data collection and RED data processing. The RED data collection program controls the transmission electron microscope and the camera. Electron beam tilts at a fine step (0.05-0.20°) are combined with goniometer tilts at a coarse step (2.0-3.0°) around a common tilt axis, which allows a fine relative tilt to be achieved between the electron beam and the crystal in a large tilt range. An electron diffraction (ED) frame is collected at each combination of beam tilt and goniometer tilt. The RED data processing program processes three-dimensional ED data generated by the RED data collection program or by other approaches. It includes shift correction of the ED frames, peak hunting for diffraction spots in individual ED frames and identification of these diffraction spots as reflections in three dimensions. Unit-cell parameters are determined from the positions of reflections in three-dimensional reciprocal space. All reflections are indexed, and finally a list with hkl indices and intensities is output. The data processing program also includes a visualizer to view and analyse three-dimensional reciprocal lattices reconstructed from the ED frames. Details of the implementation are described. Data collection and data processing with the software RED are demonstrated using a calcined zeolite sample, silicalite-1. The structure of the calcined silicalite-1, with 72 unique atoms, could be solved from the RED data by routine direct methods.

Diffraction theory

NARCIS (Netherlands)

Bouwkamp, C.J.

1954-01-01

A critical review is presented of recent progress in classical diffraction theory. Both scalar and electromagnetic problems are discussed. The report may serve as an introduction to general diffraction theory although the main emphasis is on diffraction by plane obstacles. Various modifications of

JMFA2—a graphically interactive Java program that fits microfibril angle X-ray diffraction data

Science.gov (United States)

Steve P. Verrill; David E. Kretschmann; Victoria L. Herian

2006-01-01

X-ray diffraction techniques have the potential to decrease the time required to determine microfibril angles dramatically. In this paper, we discuss the latest version of a curve-fitting toll that permits us to reduce the time required to evaluate MFA X-ray diffraction patterns. Further, because this tool reflects the underlying physics more accurately than existing...

Unusual conversations: A reflection on the mechanics of internationally engaged public scholarship

Directory of Open Access Journals (Sweden)

Jonathan Damiani

2016-09-01

Full Text Available This article analyses the civic engagement pathways of researchers from the Asia-Pacific and the United States in an effort to see how the principles of what American  scholars consider publicly engaged research and creative practice are being enacted in research sites across the globe. The purpose of this ongoing project is to focus on finding ways of connecting American scholars with a network of higher education and research institutions that hold a commitment and passion for social responsibility and civic engagement as it impacts education, research and service for community development overseas. The narrative includes the voices and perspectives of colleagues dedicated to engaged scholarship from across the new region in which I work (the Asia-Pacific, alongside the voices of some of Imagining America’s (IA 2014 National Conference participants. These conversations serve as a critical reflection on the mechanics of doing public scholarship overseas and frame a new model of internationally engaged scholarship. Keywords: Internationally engaged public scholarship, unusual conversations

Refractive Index Imaging of Cells with Variable-Angle Near-Total Internal Reflection (TIR) Microscopy.

Science.gov (United States)

Bohannon, Kevin P; Holz, Ronald W; Axelrod, Daniel

2017-10-01

The refractive index in the interior of single cells affects the evanescent field depth in quantitative studies using total internal reflection (TIR) fluorescence, but often that index is not well known. We here present method to measure and spatially map the absolute index of refraction in a microscopic sample, by imaging a collimated light beam reflected from the substrate/buffer/cell interference at variable angles of incidence. Above the TIR critical angle (which is a strong function of refractive index), the reflection is 100%, but in the immediate sub-critical angle zone, the reflection intensity is a very strong ascending function of incidence angle. By analyzing the angular position of that edge at each location in the field of view, the local refractive index can be estimated. In addition, by analyzing the steepness of the edge, the distance-to-substrate can be determined. We apply the technique to liquid calibration samples, silica beads, cultured Chinese hamster ovary cells, and primary culture chromaffin cells. The optical technique suffers from decremented lateral resolution, scattering, and interference artifacts. However, it still provides reasonable results for both refractive index (~1.38) and for distance-to-substrate (~150 nm) for the cells, as well as a lateral resolution to about 1 µm.

Measurement and Interpretation of Diffuse Scattering in X-Ray Diffraction for Macromolecular Crystallography

Energy Technology Data Exchange (ETDEWEB)

Wall, Michael E. [Los Alamos National Lab. (LANL), Los Alamos, NM (United States)

2017-10-16

X-ray diffraction from macromolecular crystals includes both sharply peaked Bragg reflections and diffuse intensity between the peaks. The information in Bragg scattering reflects the mean electron density in the unit cells of the crystal. The diffuse scattering arises from correlations in the variations of electron density that may occur from one unit cell to another, and therefore contains information about collective motions in proteins.

Dynamical theory of neutron diffraction. [One-body Schroedinger equation, review

Energy Technology Data Exchange (ETDEWEB)

Sears, V F [Atomic Energy of Canada Ltd., Chalk River, Ontario. Chalk River Nuclear Labs.

1978-10-01

We present a review of the dynamical theory of neutron diffraction by macroscopic bodies which provides the theoretical basis for the study of neutron optics. We consider both the theory of dispersion, in which it is shown that the coherent wave in the medium satisfies a macroscopic one-body Schroedinger equation, and the theory of reflection, refraction, and diffraction in which the above equation is solved for a number of special cases of interest. The theory is illustrated with the help of experimental results obtained over the past 10 years by a number of new techniques such as neutron gravity refractometry. Pendelloesung interference, and neutron interferometry.

Stress-free reference for neutron diffraction measurement of residual stress in butt-welded joints of austenitic stainless steel pipes

International Nuclear Information System (INIS)

Maekawa, Akira; Takahashi, Tsuneo; Tsuji, Takashi; Suzuki, Hiroshi; Moriai, Atsushi

2012-01-01

Stress-free lattice spacing d_0 has the most influence on reliability of neutron stress measurements made using an angle dispersive method. However, it is hard to evaluate the lattice spacing of welded structures and ductile materials such as stainless steel accurately. In this study, suitable measurement conditions for d_0 of welded pipe joints of austenitic stainless steel were discussed. The d_0 values derived from {311} and {111} reflections, which are often used in austenitic stainless steel for residual stress measurement, were examined. Comparison of the residual strains and stresses evaluated using the obtained d_0 and the finite element analysis showed that the way the d_0 values were chosen affected the measurement accuracy significantly. The stress measurement accuracy was remarkably improved when the {311} reflection was used and the proper d_0 value was chosen in the respective neutron diffraction measurements. For instance, for the axial diffraction measurements using the {311} reflection, it was recommended that only the axial d_0 value of the {311} reflection be used; the measurements using the {111} reflection were less accurate due to the large Young's modulus. Additionally, a lower diffraction angle was judged to be one of the factors leading to a decrease of the strain measurement accuracy. (author)

Synchrotron X-ray diffraction using triple-axis spectrometry

International Nuclear Information System (INIS)

Als-Nielsen, J.

1980-12-01

High resolution X-ray diffraction studies of (i) monolayers of the noble gases Kr and Ar physiosorbed on graphite (ii) smectic A fluctuations in the nematic and the smectic A phases of liquid crystals are described. The apparatus used is a triple axis spectrometer situated at the storage ring DORIS at Hasylab, DESY, Hamburg. A monochromatic, well collimated beam is extracted from the synchrotron radiation spectrum by Bragg reflection from perfect Si or Ge crystals. The direction of the beam scattered from the sample is determined by Bragg reflection from a perfect Si or Ge crystal. High intensities even with resolution extending beyond the wavelength of visible light can be obtained. (Auth.)

Structural refinement and extraction of hydrogen atomic positions in polyoxymethylene crystal based on the first successful measurements of 2-dimensional high-energy synchrotron X-ray diffraction and wide-angle neutron diffraction patterns of hydrogenated and deuterated species

International Nuclear Information System (INIS)

Tashiro, Kohji; Hanesaka, Makoto; Ohhara, Takashi; Kurihara, Kazuo; Tamada, Taro; Kuroki, Ryota; Fujiwara, Satoru; Ozeki, Tomoji; Kitano, Toshiaki; Nishu, Takashi; Tanaka, Ichiro; Niimura, Nobuo

2007-01-01

2-Dimensional X-ray and neutron diffraction patterns have been successfully measured for deuterated and hydrogenated polyoxymethylene (POM) samples obtained by γ-ray induced solid-state polymerization reaction. More than 700 reflections were collected from the X-ray diffraction data at -150degC by utilizing a high-energy synchrotron X-ray beam at SPring-8, Japan, from which the crystal structure of POM has been refined thoroughly including the extraction of hydrogen atomic positions at clearly seen in the difference Fourier synthesis map. As the first trial the nonuniform (9/5) helical model was analyzed with the reliability factor (R factor) 6.9%. The structural analysis was made also using the X-ray reflections of about 400 observed at room temperature (R 8.8%), and the thermal parameters of constituent atoms were compared between the low and high temperatures to discuss the librational thermal motion of the chains. The 2-dimensional neutron diffraction data, collected for the deuterated and hydrogenated POM samples using an imaging plate system specifically built-up for neutron scattering experiment, have allowed us to pick up the D and H atomic positions clearly in the Fourier synthesis maps. Another possible model, (29/16) helix, which was proposed by several researches, has been also investigated on the basis of the X-ray diffraction data at -150degC. The direct method succeeded in extracting this (29/16) model straightforwardly. The R factor was 8.6%, essentially the same as that of (9/5) helical model. This means that the comparison of the diffraction intensity between the data collected from the full-rotation X-ray diffraction pattern and the intensity calculated for both the (9/5) and (29/16) models cannot be used for the unique determination of the superiority of the model, (9/5) or (29/16) helix. However, we have found the existence of 001 and 002 reflections which give the longer repeating period 55.7 A. Besides there observed a series of meridional

Synchronous scattering and diffraction from gold nanotextured surfaces with structure factors

Science.gov (United States)

Gu, Min-Jhong; Lee, Ming-Tsang; Huang, Chien-Hsun; Wu, Chi-Chun; Chen, Yu-Bin

2018-05-01

Synchronous scattering and diffraction were demonstrated using reflectance from gold nanotextured surfaces at oblique (θi = 15° and 60°) incidence of wavelength λ = 405 nm. Two samples of unique auto-correlation functions were cost-effectively fabricated. Multiple structure factors of their profiles were confirmed with Fourier expansions. Bi-directional reflectance function (BRDF) from these samples provided experimental proofs. On the other hand, standard deviation of height and unique auto-correlation function of each sample were used to generate surfaces numerically. Comparing their BRDF with those of totally random rough surfaces further suggested that structure factors in profile could reduce specular reflection more than totally random roughness.

Improved Resolution Optical Time Stretch Imaging Based on High Efficiency In-Fiber Diffraction.

Science.gov (United States)

Wang, Guoqing; Yan, Zhijun; Yang, Lei; Zhang, Lin; Wang, Chao

2018-01-12

Most overlooked challenges in ultrafast optical time stretch imaging (OTSI) are sacrificed spatial resolution and higher optical loss. These challenges are originated from optical diffraction devices used in OTSI, which encode image into spectra of ultrashort optical pulses. Conventional free-space diffraction gratings, as widely used in existing OTSI systems, suffer from several inherent drawbacks: limited diffraction efficiency in a non-Littrow configuration due to inherent zeroth-order reflection, high coupling loss between free-space gratings and optical fibers, bulky footprint, and more importantly, sacrificed imaging resolution due to non-full-aperture illumination for individual wavelengths. Here we report resolution-improved and diffraction-efficient OTSI using in-fiber diffraction for the first time to our knowledge. The key to overcome the existing challenges is a 45° tilted fiber grating (TFG), which serves as a compact in-fiber diffraction device offering improved diffraction efficiency (up to 97%), inherent compatibility with optical fibers, and improved imaging resolution owning to almost full-aperture illumination for all illumination wavelengths. 50 million frames per second imaging of fast moving object at 46 m/s with improved imaging resolution has been demonstrated. This conceptually new in-fiber diffraction design opens the way towards cost-effective, compact and high-resolution OTSI systems for image-based high-throughput detection and measurement.

In-phase and anti-phase interference fringes in rocking curves of resonant X-ray dynamical diffraction

International Nuclear Information System (INIS)

Negishi, Riichirou; Fukamachi, Tomoe; Yoshizawa, Masami; Hirano, Kenji; Hirano, Keiichi; Kawamura, Takaaki

2008-01-01

We have observed the interference fringes that are in phase with each other in the diffracted and transmitted rocking curves of GaAs 200 reflection near the K-absorption edge of As. The fringes are in contrast with the well-known Pendelloesung fringes that are anti-phase with each other in the diffracted and transmitted waves. The origin of the in-phase interference fringe is analyzed to be due to the diffraction only by the imaginary part of the atomic scattering factor. It is also shown that the interference fringes become typical Pendelloesung fringes when the diffraction is caused only by the real part. (author)

Multipole electron-density modelling of synchrotron powder diffraction data: the case of diamond

DEFF Research Database (Denmark)

Svendsen, H.; Overgaard, J.; Busselez, R.

2010-01-01

between experiment and theory, and the study therefore demonstrates that synchrotron powder diffraction can indeed provide accurate structure-factor values based on data measured in minutes with limited sample preparation. Thus, potential systematic errors such as extinction and twinning commonly......Accurate structure factors are extracted from synchrotron powder diffraction data measured on crystalline diamond based on a novel multipole model division of overlapping reflection intensities. The approach limits the spherical-atom bias in structure factors extracted from overlapping powder data...

Research on Spectral Reflection Characteristics of Nanostructures in Morpho Butterfly Wing Scale

Energy Technology Data Exchange (ETDEWEB)

Wu Wenjun [Key Lab of Modern Manufacture Quality Engineering, Hubei University of Technology, Wuhan, Hubei, 30068 (China); Shi Tielin; Liao Guanglan; Zuo Haibo, E-mail: guanglan.liao@mail.hust.edu.cn [State Key Laboratory of Digital Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan, Hubei, 430074 (China)

2011-02-01

The intricate nanostructure in the scales of Morpho, which is composed of transparent cuticle protein, achieves an extremely high reflectivity in the range of visible light. The brilliant iridescent blue color is not produced by blue pigment but nanostructures. In order to investigate which structural parameters influenced the spectral reflection characteristics and formed the striking brilliance of blue color, a vector diffraction theoretical structural model was established, and simulation using rigorous coupled-wave analysis was carried out. The complex nanostructure was assumed as the diffraction grating structure of arbitrary configuration. The shape and size of the model was set according to the TEM photos of Morpho scale. The structure with irregular asymmetric multilayer lamellae ridge-like grating possessed best capability in reflectivity and color matching. The influence of every structural parameter to spectral reflectivity was cognized by comparing with the original spectrum. The results have revealed the nature of iridescent blue colors and high reflectivity, and enable us to control color and reflectivity by manufacturing nanostructure with specific structural parameter.

Research on Spectral Reflection Characteristics of Nanostructures in Morpho Butterfly Wing Scale

International Nuclear Information System (INIS)

Wu Wenjun; Shi Tielin; Liao Guanglan; Zuo Haibo

2011-01-01

The intricate nanostructure in the scales of Morpho, which is composed of transparent cuticle protein, achieves an extremely high reflectivity in the range of visible light. The brilliant iridescent blue color is not produced by blue pigment but nanostructures. In order to investigate which structural parameters influenced the spectral reflection characteristics and formed the striking brilliance of blue color, a vector diffraction theoretical structural model was established, and simulation using rigorous coupled-wave analysis was carried out. The complex nanostructure was assumed as the diffraction grating structure of arbitrary configuration. The shape and size of the model was set according to the TEM photos of Morpho scale. The structure with irregular asymmetric multilayer lamellae ridge-like grating possessed best capability in reflectivity and color matching. The influence of every structural parameter to spectral reflectivity was cognized by comparing with the original spectrum. The results have revealed the nature of iridescent blue colors and high reflectivity, and enable us to control color and reflectivity by manufacturing nanostructure with specific structural parameter.

Symmetry, stability, and diffraction properties of icosahedral crystals

International Nuclear Information System (INIS)

Bak, P.

1985-01-01

In a remarkable experiment on an Mn-Al alloy, Shechtman et al. observed a diffraction spectrum with icosahedral symmetry. This is inconsistent with discrete translational invariance since the symmetry includes a five-fold axis. In this paper, it is shown that the crystallography and diffraction pattern can be described by a six-dimensional space group. The crystal structure in 3d is obtained as a cut along a 3d hyperplane in a regular 6d crystal. Displacements of the 6d crystal along 6 orthogonal directions define 6 continuous symmetries for the icosahedral crystal, three of which are phase symmetries describing internal rearrangements of the atoms

Photoemission in case of a strongly asymmetric X-ray dinamic diffraction

International Nuclear Information System (INIS)

Kruglov, M.V.; Sazontov, E.A.; Solomin, I.K.

1985-01-01

Possibility has been studied of utilizing strongly asymmet-- ric reflections, in particular in case when the reflected wave slips at a small angle along the surface, for investigating the structural violations of the surface crystal layers. Angular dependence extrinsic photoeffect (ADEP) in the region of X-ray incedence angles close to the Bragg diffraction angle was studied in this paper conformably to crystals with a distorted surface layer. Measurements were conducted with ideal germanium crystals using CuKsub(α) radiation reflections (220) and silicon crystals using CrKsub(α) radiation reflections (22O). It is shown that, in investigating deformed surface layers with low thichkness and large variation of interplanar space, as compared to the basic crystal matric, application of strongly asymmetric reflections anables to increase the sensitivity and information content of the method of abnormal ADEP

Experimental analysis of bidirectional reflectance distribution function cross section conversion term in direction cosine space.

Science.gov (United States)

Butler, Samuel D; Nauyoks, Stephen E; Marciniak, Michael A

2015-06-01

Of the many classes of bidirectional reflectance distribution function (BRDF) models, two popular classes of models are the microfacet model and the linear systems diffraction model. The microfacet model has the benefit of speed and simplicity, as it uses geometric optics approximations, while linear systems theory uses a diffraction approach to compute the BRDF, at the expense of greater computational complexity. In this Letter, nongrazing BRDF measurements of rough and polished surface-reflecting materials at multiple incident angles are scaled by the microfacet cross section conversion term, but in the linear systems direction cosine space, resulting in great alignment of BRDF data at various incident angles in this space. This results in a predictive BRDF model for surface-reflecting materials at nongrazing angles, while avoiding some of the computational complexities in the linear systems diffraction model.

Application of holographic sub-wavelength diffraction gratings for monitoring of kinetics of bioprocesses

Science.gov (United States)

Tamulevičius, Tomas; Šeperys, Rimas; Andrulevičius, Mindaugas; Kopustinskas, Vitoldas; Meškinis, Šarūnas; Tamulevičius, Sigitas; Mikalayeva, Valeryia; Daugelavičius, Rimantas

2012-09-01

In this work we present a refractive index (RI) sensor based on a sub-wavelength holographic diffraction grating. The sensor chip was fabricated by dry etching of the finely spaced (d = 428 nm) diffraction grating in SiOx doped diamond like carbon (DLC) film. It is shown that employing a fabricated sensor chip, and using the proposed method of analysis of data, one can inspect kinetics of processes in liquids occurring in the vicinity of the grating surface. The method is based on the spectral composition analysis of polarized polychromatic light reflected from the sub-wavelength diffraction grating. The RI measurement system was tested with different model liquid analytes including 25 wt.%, 50 wt.% sugar water solutions, 10 °C, 50 °C distilled water, also Gram-positive bacteria Bacillus subtilis interaction with ion-permeable channels forming antibiotic gramicidin D and a murolytic enzyme lysozyme. Analysis of the data set of specular reflection spectra enabled us to follow the kinetics of the RI changes in the analyte with millisecond resolution. Detectable changes in the effective RI were not worse than Δn = 10-4.

Assessment of the out-plane and in-plane ordering of high quality ZnO nanorods by X-ray multiple diffraction

International Nuclear Information System (INIS)

Martínez-Tomás, M.C.; Montenegro, D.N.; Agouram, S.; Sallet, V.; Muñoz-Sanjosé, V.

2013-01-01

ZnO nanorods grown on buffered and non buffered sapphire substrates have been investigated by X-ray multiple diffraction using Renninger scans of the ZnO(0001) and ZnO(0003) forbidden reflections. In this technique the diffracted X-ray beam is simultaneously diffracted by several sets of planes, providing information on the broadening in different directions, as well as from nanorods, and from the layer on which they grow. The intensities and angular widths of peaks obtained by azimuthal and omega scans have been analyzed, making a direct comparison with conventional measurements of the full width at half-maximum of symmetric and asymmetric reflections. The analysis leads to establish that the peaks of the Renninger scan are highly sensitive to structural characteristics, providing information related with both the out-plane and in-plane ordering of nanostructured samples with a single scan. - Highlights: ► Structural characteristics of ZnO nanorods have been analyzed by X-ray multiple diffraction. ► X-ray multiple diffraction can provide mosaic structure characteristics from a single scan. ► Peaks of Renninger scan result to be very sensitive to structural characteristics. ► X-ray multiple diffraction can be an alternative analysis method to X-ray diffraction

Assessment of the out-plane and in-plane ordering of high quality ZnO nanorods by X-ray multiple diffraction

Energy Technology Data Exchange (ETDEWEB)

Martínez-Tomás, M.C., E-mail: Carmen.Martinez-tomas@uv.es [Departamento de Física Aplicada y Electromagnetismo, Universitat de Valencia, Dr. Moliner 50, 46100 Burjassot (Spain); Montenegro, D.N.; Agouram, S. [Departamento de Física Aplicada y Electromagnetismo, Universitat de Valencia, Dr. Moliner 50, 46100 Burjassot (Spain); Sallet, V. [Groupe d' Etude de la Matière Condensée (GEMAC), CNRS-Université de Versailles St-Quentin, 45 avenue des Etats-Unis, 78035 Versailles Cedex (France); Muñoz-Sanjosé, V. [Departamento de Física Aplicada y Electromagnetismo, Universitat de Valencia, Dr. Moliner 50, 46100 Burjassot (Spain)

2013-08-31

ZnO nanorods grown on buffered and non buffered sapphire substrates have been investigated by X-ray multiple diffraction using Renninger scans of the ZnO(0001) and ZnO(0003) forbidden reflections. In this technique the diffracted X-ray beam is simultaneously diffracted by several sets of planes, providing information on the broadening in different directions, as well as from nanorods, and from the layer on which they grow. The intensities and angular widths of peaks obtained by azimuthal and omega scans have been analyzed, making a direct comparison with conventional measurements of the full width at half-maximum of symmetric and asymmetric reflections. The analysis leads to establish that the peaks of the Renninger scan are highly sensitive to structural characteristics, providing information related with both the out-plane and in-plane ordering of nanostructured samples with a single scan. - Highlights: ► Structural characteristics of ZnO nanorods have been analyzed by X-ray multiple diffraction. ► X-ray multiple diffraction can provide mosaic structure characteristics from a single scan. ► Peaks of Renninger scan result to be very sensitive to structural characteristics. ► X-ray multiple diffraction can be an alternative analysis method to X-ray diffraction.

X-ray diffraction patterns of single crystals implanted with high-energy light ions

International Nuclear Information System (INIS)

Wieteska, K.

1998-01-01

X-ray diffraction patterns of silicon and gallium arsenide single crystals implanted with high-energy protons and α-particles were studied. A various models of lattice parameter changes were analysed. The agreement between the simulation and experiment proves that the lattice parameter depth-distribution can be assumed to be proportional to vacancy distribution obtained by Monte-Carlo method and from the Biersack-Ziegler theory. Most of the X-ray experiments were performed using synchrotron source of X-ray radiation in particular in the case of back-reflection and transmission section topographic methods. The new method of direct determination of the implanted ion ranges was proposed using synchrotron radiation back-reflection section topography. A number of new interference phenomena was revealed and explained. These interferences are important in the applications of diffraction theory in studying of the real structure of implanted layers. (author)

Overview of diffraction gratings technologies for space-flight satellites and astronomy

Science.gov (United States)

Cotel, Arnaud; Liard, Audrey; Desserouer, Frédéric; Bonnemason, Francis; Pichon, Pierre

2014-09-01

The diffraction gratings are widely used in Space-flight satellites for spectrograph instruments or in ground-based telescopes in astronomy. The diffraction gratings are one of the key optical components of such systems and have to exhibit very high optical performances. HORIBA Jobin Yvon S.A.S. (part of HORIBA Group) is in the forefront of such gratings development for more than 40 years. During the past decades, HORIBA Jobin Yvon (HJY) has developed a unique expertise in diffraction grating design and manufacturing processes for holographic, ruled or etched gratings. We will present in this paper an overview of diffraction grating technologies especially designed for space and astronomy applications. We will firstly review the heritage of the company in this field with the space qualification of different grating types. Then, we will describe several key grating technologies developed for specific space or astronomy projects: ruled blazed low groove density plane reflection grating, holographic blazed replica plane grating, high-groove density holographic toroidal and spherical grating and transmission Fused Silica Etched (FSE) grismassembled grating.

X-ray diffraction study of stacking faults in a single crystal of 2H SiC

International Nuclear Information System (INIS)

Pandey, D.; Krishna, P.

1977-01-01

The nature of random stacking faults in a heavily disordered single crystal of 2H SiC has been investigated by studying the broadening of x-ray diffraction maxima. The intensity distribution along the 10.1 reciprocal lattice row was recorded on a four-circle, computer-controlled single crystal diffractometer. The 10.1 reflections with 1 even were found to be considerably broadened showing that the stacking faults present are predominantly intrinsic faults ( both growth and deformation faults). A careful study of the half-width values of different 10.1 reflections revealed that the fault probabilities are large. Exact expressions for the diffracted intensity and the observable diffraction effects were obtained and these were then used to calculate the deformation and growth fault probabilities which were found to be 0.20 and 0.11 respectively. It is suggested that several deformation fault configurations result from a clustering of growth faults. The results obtained are compared with those obtained for 2H ZnS crystals. (author)

Neutron diffraction study of the β1-β2 transformation in Ta2D

International Nuclear Information System (INIS)

Kaneko, H.; Kajitani, T.; Hirabayashi, M.

1984-01-01

The β 1 -β 2 phase transformation in Ta 2 D was studied by neutron diffraction using the pulsed source at the Tohoku Linac and the Intense Pulsed Neutron Source, Argonne National Laboratory. It was found that the hhO reflections almost disappear in the β 2 phase, whereas the 00l reflections are the same as those in the β 1 phase. The diffraction data show that the β 2 phase has an orthorhombic unit cell which is identical with that of the β 1 phase and contains four tantalum and two deuterium atoms in a volume which is approximately 2sup(1/2) X 1 X 2sup(1/2) that of the b.c.c. host lattice. The deuterium atoms fractionally occupy the tetrahedral sites in alternate (002)sub(orth) planes. (Auth.)

Secondary extinction in cylindrical and spherical crystals for X-ray and neutron diffraction

International Nuclear Information System (INIS)

Hu Huachen; Li Zhaohuan; Yang Bin; Shen Caiwan

2001-01-01

The distribution of the reflection power ratio for a neutron or x-ray diffracted from a cylindrical crystal immersed in an homogenous incident beam is obtained by the numerical solution of the transfer equations for the first time. The profile well reflects all the physical properties of the absorption and extinction behaviour in the crystals. A systematic investigation of the secondary extinction for cylindrical and spherical crystals was carried out based on these results

Time-of-flight diffraction at pulsed neutron sources: An introduction to the symposium

International Nuclear Information System (INIS)

Jorgensen, J.D.

1994-01-01

In the 25 years since the first low-power demonstration experiments, pulsed neutron sources have become as productive as reactor sources for many types of diffraction experiments. The pulsed neutron sources presently operating in the United States, England, and Japan offer state of the art instruments for powder and single crystal diffraction, small angle scattering, and such specialized techniques as grazing-incidence neutron reflection, as well as quasielastic and inelastic scattering. In this symposium, speakers review the latest advances in diffraction instrumentation for pulsed neutron sources and give examples of some of the important science presently being done. In this introduction to the symposium, I briefly define the basic principles of pulsed neutron sources, review their development, comment in general terms on the development of time-of-flight diffraction instrumentation for these sources, and project how this field will develop in the next ten years

Diffractive optics and nanophotonics resolution below the diffraction limit

CERN Document Server

Minin, Igor

2016-01-01

In this book the authors present several examples of techniques used to overcome the Abby diffraction limit using flat and 3D diffractive optical elements, photonic crystal lenses, photonic jets, and surface plasmon diffractive optics. The structures discussed can be used in the microwave and THz range and also as scaled models for optical frequencies. Such nano-optical microlenses can be integrated, for example, into existing semiconductor heterostructure platforms for next-generation optoelectronic applications. Chapter 1 considers flat diffractive lenses and innovative 3D radiating structures including a conical millimeter-wave Fresnel zone plate (FZP) lens proposed for subwavelength focusing. In chapter 2 the subwavelength focusing properties of diffractive photonic crystal lenses are considered and it is shown that at least three different types of photonic crystal lens are possible.  With the aim of achieving subwavelength focusing, in chapter 3 an alternative mechanism to produce photonic jets at Tera...

A more general expression for the average X-ray diffraction intensity of crystals with an incommensurate one-dimensional modulation

International Nuclear Information System (INIS)

Lam, E.J.W.; Beurskens, P.T.; Smaalen, S. van

1994-01-01

Statistical methods are used to derive an expression for the average X-ray diffraction intensity, as a function of (sinθ)/λ, of crystals with an incommensurate one-dimensional modulation. Displacive and density modulations are considered, as well as a combination of these two. The atomic modulation functions are given by truncated Fourier series that may contain higher-order harmonics. The resulting expression for the average X-ray diffraction intensity is valid for main reflections and low-order satellite reflections. The modulation of individual atoms is taken into account by the introduction of overall modulation amplitudes. The accuracy of this expression for the average X-ray diffraction intensity is illustrated by comparison with model structures. A definition is presented for normalized structure factors of crystals with an incommensurate one-dimensional modulation that can be used in direct-methods procedures for solving the phase problem in X-ray crystallography. A numerical fitting procedure is described that can extract a scale factor, an overall temperature parameter and overall modulation amplitudes from experimental reflection intensities. (orig.)

Acquiring the fundamentals: an accredited powder diffraction course on the internet

International Nuclear Information System (INIS)

Crockcroft, J.K.; Barnes, P.; Attfield, M.P.; Cranswick, L.M.D.

2002-01-01

Full text: In August 1999, building on accredited academic-based crystallographic web courses pioneered by Birkbeck College, University of London, for Protein Crystallography and Principles of Protein Structure, a new 'Advanced Certificate in Powder Diffraction' was officially announced at the International Union of Crystallography congress in Glasgow. Offering tuition via the Internet on the fundamentals in powder diffraction, it is now running successfully into its third year. The background of student intake ranges from new PhD students to scientists, technicians and X-ray analysts in commercial companies. The work for this 1 year long course, takes around 6 to 8 hours a week to complete; and should not be considered equivalent to recreational web browsing, but as serious study. If this course is done as part of staff training and development, it is important that the employer recognize this; and that adequate training time is set aside as part of the working week. The 'Advanced Certificate in Powder Diffraction' is assessed by a mixture of 'coursework', computer based data analysis project and a formal written exam taken at a local university. To obtain the full qualification, the exam must be taken, but it is optional if only training and no formal qualification is required. The course content covers a broad range of knowledge required for an 'understanding' of powder diffraction. These include the Internet Skills required to do the course, Diffraction Instrumentation, Laboratory Methods, Synchrotron Sources and Methods, Neutron Sources, Diffraction Theory, Electron Scattering to Structure Factors, Structure Factors to Diffraction Intensities, the concept of Symmetry to 3-D Symmetry Elements, Point Groups, Space Groups, Space-Group Determination, Interpreting the IUCr International Tables, Qualitative Analysis, Quantitative Analysis, Indexing, Unit-Cell Refinement, Peak Shapes, Structure Refinement and the Rietveld Method, Modern Techniques and Applications

Time and space domain separation of pulsed X-ray beams diffracted from vibrating crystals

Energy Technology Data Exchange (ETDEWEB)

Nosik, V. L., E-mail: v-nosik@yandex.ru, E-mail: nosik@ns.crys.ras.ru [Russian Academy of Sciences, Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,” (Russian Federation)

2016-11-15

It is known that a set of additional reflections (satellites) may arise on rocking curves in the case of X-ray diffraction in the Bragg geometry from crystals where high-frequency ultrasonic vibrations are excited. It is shown that, under certain conditions, the pulse wave fields of the satellites and main reflection may be intersected in space (playing the role of pump and probe beams) and in time (forming interference superlattices).

Developments in diffraction databases

International Nuclear Information System (INIS)

Jenkins, R.

1999-01-01

Full text: There are a number of databases available to the diffraction community. Two of the more important of these are the Powder Diffraction File (PDF) maintained by the International Centre for Diffraction Data (ICDD), and the Inorganic Crystal Structure Database (ICSD) maintained by Fachsinformationzentrum (FIZ, Karlsruhe). In application, the PDF has been used as an indispensable tool in phase identification and identification of unknowns. The ICSD database has extensive and explicit reference to the structures of compounds: atomic coordinates, space group and even thermal vibration parameters. A similar database, but for organic compounds, is maintained by the Cambridge Crystallographic Data Centre. These databases are often used as independent sources of information. However, little thought has been given on how to exploit the combined properties of structural database tools. A recently completed agreement between ICDD and FIZ, plus ICDD and Cambridge, provides a first step in complementary use of the PDF and the ICSD databases. The focus of this paper (as indicated below) is to examine ways of exploiting the combined properties of both databases. In 1996, there were approximately 76,000 entries in the PDF and approximately 43,000 entries in the ICSD database. The ICSD database has now been used to calculate entries in the PDF. Thus, to derive d-spacing and peak intensity data requires the synthesis of full diffraction patterns, i.e., we use the structural data in the ICSD database and then add instrumental resolution information. The combined data from PDF and ICSD can be effectively used in many ways. For example, we can calculate PDF data for an ideally random crystal distribution and also in the absence of preferred orientation. Again, we can use systematic studies of intermediate members in solid solutions series to help produce reliable quantitative phase analyses. In some cases, we can study how solid solution properties vary with composition and

Nanograting-based plasmon enhancement for total internal reflection fluorescence microscopy of live cells

International Nuclear Information System (INIS)

Kim, Kyujung; Cho, Eun-Jin; Suh, Jin-Suck; Huh, Yong-Min; Kim, Donghyun; Kim, Dong Jun

2009-01-01

We investigated evanescent field enhancement based on subwavelength nanogratings for improved sensitivity in total internal reflection microscopy of live cells. The field enhancement is associated with subwavelength-grating-coupled plasmon excitation. An optimum sample employed a silver grating on a silver film and an SF10 glass substrate. Field intensity was enhanced by approximately 90% when measured by fluorescent excitation of microbeads relative to that on a bare prism as a control, which is in good agreement with numerical results. The subwavelength-grating-mediated field enhancement was also applied to live cell imaging of quantum dots, which confirmed the sensitivity enhancement qualitatively.

Nonpolarizing beam splitter designed by frustrated total internal reflection inside a glass cube.

Science.gov (United States)

Xu, Xueke; Shao, Jianda; Fan, Zhengxiu

2006-06-20

A method for the design of an all-dielectric nonpolarizing prism beam splitter utilizing the principle of frustrated total internal reflection is reported. The nonpolarizing condition for a prism beam splitter is discussed, and some single layer design examples are elaborated. The concept can be applied to a wide range of wavelengths and arbitrary transmittance values, and with the help of a computer design program examples of 400-700 nm, T(p)=T(s)=0.5+/-0.01, with incident angles of 45 degrees and 62 degrees are given. In addition, the sensitivity and application of the design are also discussed.

Molecular beam epitaxial growth mechanism of ZnSe epilayers on (100) GaAs as determined by reflection high-energy electron diffraction, transmission electron microscopy and X-ray diffraction

Energy Technology Data Exchange (ETDEWEB)

Ruppert, P.; Hommel, D.; Behr, T.; Heinke, H.; Waag, A.; Landwehr, G. (Physikalisches Inst., Univ. Wuerzburg (Germany))

1994-04-14

The properties of molecular beam epitaxial growth of ZnSe epilayers deposited directly on a GaAs substrate are compared to those grown on a GaAs buffer layer. The superior quality of the latter is confirmed by RHEED, TEM and X-ray diffraction. Based on RHEED oscillation studies, a model explaining the dependence of the ZnSe growth rate on Zn and Se fluxes and the substrate temperature is developed taking into account physisorbed and chemisorbed states. For partially relaxed epilayers, the correlation between the relaxation state and the crystalline mosaicity, as found by high resolution X-ray diffraction, is discussed

Holographic diffraction gratings as laser radiation protection filters

International Nuclear Information System (INIS)

Pantelic, D.; Pantelic, G.

2006-01-01

Holographic volume diffraction gratings are used as attenuation filters, due to their selective spectral transmission. They can be tailored to reflect or transmit narrow spectral ranges by adjusting spatial frequency of Bragg grating in carefully chosen photosensitive materials, like silver-halide emulsion or di-chromated gelatin layers. If properly recorded and chemically processed, resulting gratings can significantly attenuate light at wavelengths corresponding to various laser spectral lines. Thus, they can be used as filters in laser protection goggles. We analyze the characteristics of Bragg gratings necessary to obtain high attenuation coefficients. Also, their angular selectivity is taken into account and corresponding experimental conditions are investigated. Although di-chromated gelatin seems to be almost ideal material, due to its almost 100% diffraction efficiency, environmental stability is poor (degradation under humid environment), thus making its practical usage difficult. Thus, we have analyzed alternative materials like di-chromated pullulan, which is stable under normal environmental conditions (without drop in diffraction efficiency after prolonged exposure to humidity). Pullulan is polymer (polysaccharide) of biologic origin produced by certain bacteria. If doped with chromium ions it becomes photosensitive, enabling recording of diffraction gratings with spatial frequency of more than 3000 lines/mm. Material is chemically processed by mixture of isopropyl alcohol and water. Both thick and thin layers can be produced by gravity settling. Spectral properties of resulting gratings are analyzed, showing that they can significantly attenuate laser light of particular wavelength, depending of grating period and its slant angle. (authors)

Quantitative method of X-ray diffraction phase analysis of building materials

International Nuclear Information System (INIS)

Czuba, J.; Dziedzic, A.

1978-01-01

Quantitative method of X-ray diffraction phase analysis of building materials, with use of internal standard, has been presented. The errors committed by determining the content of particular phases have been also given. (author)

Common-path configuration in total internal reflection digital holography microscopy.

Science.gov (United States)

Calabuig, Alejandro; Matrecano, Marcella; Paturzo, Melania; Ferraro, Pietro

2014-04-15

Total Internal Reflection Digital Holographic Microscopy (TIRDHM) is recognized to be a powerful tool for retrieving quantitative phase images of cell-substrate interfaces, adhesions, and tissue structures close to the prism surface. In this Letter, we develop an improved TIRDHM system, taking advantage of a refractive index mismatch between the prism and the sample substrate, to allow phase-shifting DH with just a single-beam interferometric configuration. Instead of the traditional off-axis method, phase-shift method is used to retrieve amplitude and phase images in coherent light and TIR modality. Essentially, the substrate-prism interface acts like a beam splitter generating a reference beam, where the phase-shift dependence on the incident angle is exploited in this common-path configuration. With the aim to demonstrate the technique's validity, some experiments are performed to establish the advantage of this compact and simple configuration, in which the reference arm in the setup is avoided.

X-ray diffraction patterns in high-energy proton implanted silicon

International Nuclear Information System (INIS)

Wieteska, K.; Dluzewska, K.D.; Wierzchowski, W.; Graeff, W.

1998-01-01

Silicon crystals implanted with 1 and 1.6 MeV protons were studied by means of conventional source double-crystal and synchrotron multi-crystal arrangements. Both the rocking curves and series of topographs were recorded in different parallel settings employing different reflections and wavelengths of radiation. A comparison of rocking curves in different regions of implanted areas was performed in synchrotron multi-crystal arrangement with a beam of a very small diameter. The rocking curves exhibited subsidiary interference maxima with increasing periodicity on the low angle side. The plane wave topographs taken at different angular setting revealed characteristic fringes whose number decreased with increasing distance from the main maximum. The fringe pattern did not depend on the direction of the diffraction vector. The number of fringes for equivalent angular distance from the maximum was larger for higher order of reflection. The shape of the rocking curve and other diffraction patterns were reasonably explained assuming the lattice parameter change depth distribution proportional to the profile obtained from the Biersack-Ziegler theory and lateral non-uniformity of ion dose. A good approximation of the experimental results was obtained using numerical integration of the Takagi-Taupin equations. (orig.)

Trapping of microwave radiation in hollow polypyrrole microsphere through enhanced internal reflection: A novel approach

OpenAIRE

Ritwik Panigrahi; Suneel K. Srivastava

2015-01-01

In present work, spherical core (polystyrene, PS)/shell (polypyrrole, PPy) has been synthesized via in situ chemical oxidative copolymerization of pyrrole (Py) on the surface of sulfonated PS microsphere followed by the formation of hollow polypyrrole (HPPy) shell by dissolving PS inner core in THF. Thereafter, we first time established that such fabricated novel art of morphology acts as a conducting trap in absorbing electromagnetic (EM) wave by internal reflection. Further studies have bee...

Anthropology and the peasant class: the pertinence of the persistent. Anthropological reflections on peasant internationalism

Directory of Open Access Journals (Sweden)

Raúl Hernán Contreras Román

2015-12-01

Full Text Available The present article develops an initial discussion on the persistence of the peasant class in anthropology as an awkward object, which since it has become asubject for the discipline has  obliged anthropologists to re-examine their disciplinary identity and re-think their theoretical  bases. We start from the idea that both the emergence and the decline of peasant studies in the discipline have corresponded with localizable social, intellectual and political contexts. For this  reason we present the current struggle of peasant internationalism, represented by the international movement Vía Campesina, for food sovereignty and international recognition of the  rights of peasant men and women. These struggles are considered to constitute a politically novel space which has the potential to generate political opportunities for peasant claims in the face of  neoliberal despoliation. Finally, we reflect on how these struggles again present the peasant class as an awkward object for anthropology and demand anthropological discussion of the subject.

The bent crystal diffraction spectrometer at the BR2 reactor in Mol

Science.gov (United States)

Kaerts, E.; Jacobs, L.; Vandenput, G.; Van Assche, P. H. M.

1988-05-01

The DuMond-type bent crystal diffraction spectrometer installed at the BR2 reactor in Mol is presented. The spectrometer is mainly designed to study nuclear γ-transitions following thermal neutron capture. It covers the energy interval 25 ≦ Eγ ≦ 1500 keV. Instead of the traditionally used quartz crystals, a highly perfect silicium crystal is chosen as analysing crystal. Diffraction occurs from the (220) plane. The "quasi-mosaic" width, introduced by bending the crystal, is as small as 0.2″. The integrated reflecting power R of the bent crystal stays constant up to 1.5 MeV in first, 680 keV in second and 300 keV in third diffraction order. For higher photon energies, only an E-1 energy dependence is observed in second and third diffraction order. Consequently, besides improving the energy resolution, the use of these silicium crystals substantially increases the spectrometer efficiency and extends the high energy limit of bent crystal diffraction spectrometers. The diffraction angles are measured with a symmetrical interferometer system which covers an angular range of -6° to +6° with a precision of about 0.01″. Minimum diffraction line widths of 0.9″ have been measured, corresponding to an energy resolution ΔE = 1.35 × 10 -6E2n-1 keV -1. The dominant contribution to the observed line widths arises from the finite extent of the source.

Measurements of transient electron density distributions by femtosecond X-ray diffraction; Messungen transienter Elektronendichteverteilungen durch Femtosekunden-Roentgenbeugung

Energy Technology Data Exchange (ETDEWEB)

Freyer, Benjamin

2013-05-02

This thesis concerns measurements of transient charge density maps by femtosecond X-ray diffraction. Different X-ray diffraction methods will be considered, particularly with regard to their application in femtosecond X-ray diffraction. The rotation method is commonly used in stationary X-ray diffraction. In the work in hand an X-ray diffraction experiment is demonstrated, which combines the method with ultrafast X-ray pulses. This experiment is the first implementation which makes use of the rotation method to map transient intensities of a multitude of Bragg reflections. As a prototype material Bismuth is used, which previously was studied frequently by femtosecond X-ray diffraction by measuring Bragg reflections successively. The experimental results of the present work are compared with the literature data. In the second part a powder-diffraction experiment will be presented, which is used to study the dynamics of the electron-density distribution on ultrafast time scales. The experiment investigates a transition metal complex after photoexcitation of the metal to ligand charge transfer state. Besides expected results, i. e. the change of the bond length between the metal and the ligand and the transfer of electronic charge from the metal to the ligand, a strong contribution of the anion to the charge transfer was found. Furthermore, the charge transfer has predominantly a cooperative character. That is, the excitation of a single complex causes an alteration of the charge density of several neighboring units. The results show that more than 30 transition-metal complexes and 60 anions contribute to the charge transfer. This collective response is a consequence of the strong coulomb interactions of the densely packed ions.

Study of the α and β phases of quartz by neutron multiple diffraction

International Nuclear Information System (INIS)

Mazzocchi, V.L.

1984-01-01

Crystal structures of α and β phases of quartz are studied, employing neutron multiple diffraction as a method of analysis. Theoretical multiple diffraction patterns in a many-beam case were determined by a computer program which calculates intensities of beams as sums of Taylor's series expansions, retaining terms up to a order n. Experimental 'umweg' and transmitted beam patterns were obtained for the 00.1 primary reflection of α and β phases of quartz. To calculate α - quartz multiple diffraction intensities it was necessary to determine the Dauphine twinning fraction for the crystal after having passed by the β-phase. For the two models of β-quartz a better agreement between experimental and calculated integrated intensities was found for the disordered structure model based on split-half-oxigen positions. (Author) [pt

Diffraction coherence in optics

CERN Document Server

Françon, M; Green, L L

2013-01-01

Diffraction: Coherence in Optics presents a detailed account of the course on Fraunhofer diffraction phenomena, studied at the Faculty of Science in Paris. The publication first elaborates on Huygens' principle and diffraction phenomena for a monochromatic point source and diffraction by an aperture of simple form. Discussions focus on diffraction at infinity and at a finite distance, simplified expressions for the field, calculation of the path difference, diffraction by a rectangular aperture, narrow slit, and circular aperture, and distribution of luminous flux in the airy spot. The book th

Elastic and Diffractive Scattering - Proceedings of the International Conference on Vth Blois Workshop

Science.gov (United States)

Kang, K.; Fried, H. M.; Tan, C.-I.

1994-02-01

The Table of Contents for the book is as follows: * Preface * `Overview' on Elastic Scattering and Total Cross-Sections * A Precise Measurement of the Real Part of the Elastic Scattering Amplitude at the {S bar{p}pS} * Luminosity Dependent Measurement of the p bar{p} Total Cross Section at √{s} = 541 GeV * Status of Fermilab E-710 * Luminosity-Independent Measurement of bar{p}p Elastic Scattering, Single Diffraction, Dissociation and Total Cross Section at √{s} = 546 and 1800 GeV * Phase Relations Revisited: A Challenge for SSC and LHC * Status of Near-Forward Elastic Scattering * bar{p}p Collisions at √{s} = 1.8 TeV: p, σt and B * p bar{p} Forward Scattering Parameters Results from Fermilab E760 * Photoproduction Results from H1 at HERA * Total and Jet Photoproduction Cross Sections at HERA and Fermilab * Minijet Model for High Energy γp Cross Sections * The Pomeron as Massive Gluons * Large N Theories with Glueball-like Spectra * Unitarity Relations for Gluonic Pomeron * The Donnachie-Landshoff Pomeron vs. QCD * The Odderon Intercept in Perturbative QCD * Theoret. and Phenomenol. Aspects of the Odderon * First Theorist's Gaze at HERA Data at Low xB * H1 Results for Structure Functions at Small x * Partial Photoproduction Cross Sections at √{s} ≈prox 180 GeV and First Results on F2 of the Proton from the ZEUS Experiment * Observation of a New Class of Events in Deep Inelastic Scattering * Jet Production in Muon-Proton and Muon-Nuclei Scattering at Fermilab-E665 * D0 Studies of Perturbative QCD * Large Rapidity Gaps and Single Diffraction Dissociation in High Energy pp and bar{p}p Collisions * Hadron and Reggeon Structure in High Energy Collisions * Monte Carlo Studies of Diffractive Processes in Deep Inelastic Scattering * Elastic Parton-Parton Amplitudes in Geometrical Models * Non-Perturbative QCD Calculations of High-Energy Observables * Effective Field Theory for Diffractive QCD Processes * High Energy Behavior of σtot, ρ, and B - Asymptotic

Identification of inversion domains in KTiOPO{sub 4}via resonant X-ray diffraction

Energy Technology Data Exchange (ETDEWEB)

Fabrizi, Federica, E-mail: federica.fabrizi@diamond.ac.uk [Diamond Light Source, Harwell Science and Innovation Campus, Didcot, OX11 0DE (United Kingdom); Thomas, Pamela A. [Department of Physics, University of Warwick, Coventry, CV4 7AL (United Kingdom); Nisbet, Gareth; Collins, Stephen P. [Diamond Light Source, Harwell Science and Innovation Campus, Didcot, OX11 0DE (United Kingdom)

2015-05-14

The identification and high-resolution mapping of the absolute crystallographic structure in multi-domain ferroelectric KTiOPO{sub 4} is achieved through a novel synchrotron X-ray diffraction method. On a single Bragg reflection, the intensity ratio in resonant diffraction below and above the Ti absorption K edge demonstrates a domain contrast up to a factor of ∼270, thus implementing a non-contact, non-destructive imaging technique with micrometre spatial resolution, applicable to samples of arbitrarily large dimensions. A novel method is presented for the identification of the absolute crystallographic structure in multi-domain polar materials such as ferroelectric KTiOPO{sub 4}. Resonant (or ‘anomalous’) X-ray diffraction spectra collected across the absorption K edge of Ti (4.966 keV) on a single Bragg reflection demonstrate a huge intensity ratio above and below the edge, providing a polar domain contrast of ∼270. This allows one to map the spatial domain distribution in a periodically inverted sample, with a resolution of ∼1 µm achieved with a microfocused beam. This non-contact, non-destructive technique is well suited for samples of large dimensions (in contrast with traditional resonant X-ray methods based on diffraction from Friedel pairs), and its potential is particularly relevant in the context of physical phenomena connected with an absence of inversion symmetry, which require characterization of the underlying absolute atomic structure (such as in the case of magnetoelectric coupling and multiferroics)

The effect of experimental resolution on crystal reflectivity and secondary extinction in neutron diffraction

DEFF Research Database (Denmark)

Dietrich, O.W.; Als-Nielsen, Jens Aage

1965-01-01

The reflectivity for neutrons of a plane slab crystal is calculated in the transmission case when the crystal is placed between two Seller collimators. The calculations indicate that the crystal reflectivity, as well as the secondary extinction coefficient, depends signicantly on the angular...... resolution of the collimators. Curves are given for the extinction of the crystal with different crystal and collimator parameters....

Analysis of thin-film polymers using attenuated total internal reflection-Raman microspectroscopy.

Science.gov (United States)

Tran, Willie; Tisinger, Louis G; Lavalle, Luis E; Sommer, André J

2015-01-01

Two methods commonly employed for molecular surface analysis and thin-film analysis of microscopic areas are attenuated total reflection infrared (ATR-IR) microspectroscopy and confocal Raman microspectroscopy. In the former method, the depth of the evanescent probe beam can be controlled by the wavelength of light, the angle of incidence, or the refractive index of the internal reflection element. Because the penetration depth is proportional to the wavelength of light, one could interrogate a smaller film thickness by moving from the mid-infrared region to the visible region employing Raman spectroscopy. The investigation of ATR Raman microspectroscopy, a largely unexplored technique available to Raman microspectroscopy, was carried out. A Renishaw inVia Raman microscope was externally modified and used in conjunction with a solid immersion lens (SIL) to perform ATR Raman experiments. Thin-film polymer samples were analyzed to explore the theoretical sampling depth for experiments conducted without the SIL, with the SIL, and with the SIL using evanescent excitation. The feasibility of micro-ATR Raman was examined by collecting ATR spectra from films whose thickness measured from 200 to 60 nm. Films of these thicknesses were present on a much thicker substrate, and features from the underlying substrate did not become visible until the thin film reached a thickness of 68 nm.

Single-Molecule Fluorescence Studies of Membrane Transporters Using Total Internal Reflection Microscopy.

Science.gov (United States)

Goudsmits, Joris M H; van Oijen, Antoine M; Slotboom, Dirk J

2017-01-01

Cells are delineated by a lipid bilayer that physically separates the inside from the outer environment. Most polar, charged, or large molecules require proteins to reduce the energetic barrier for passage across the membrane and to achieve transport rates that are relevant for life. Here, we describe techniques to visualize the functioning of membrane transport proteins with fluorescent probes at the single-molecule level. First, we explain how to produce membrane-reconstituted transporters with fluorescent labels. Next, we detail the construction of a microfluidic flow cell to image immobilized proteoliposomes on a total internal reflection fluorescence microscope. We conclude by describing the methods that are needed to analyze fluorescence movies and obtain useful single-molecule data. © 2017 Elsevier Inc. All rights reserved.

Single cell adhesion strength assessed with variable-angle total internal reflection fluorescence microscopy

Directory of Open Access Journals (Sweden)

Marcelina Cardoso Dos Santos

2017-06-01

Full Text Available We propose a new strategy to evaluate adhesion strength at the single cell level. This approach involves variable-angle total internal reflection fluorescence microscopy to monitor in real time the topography of cell membranes, i.e. a map of the membrane/substrate separation distance. According to the Boltzmann distribution, both potential energy profile and dissociation energy related to the interactions between the cell membrane and the substrate were determined from the membrane topography. We have highlighted on glass substrates coated with poly-L-lysine and fibronectin, that the dissociation energy is a reliable parameter to quantify the adhesion strength of MDA-MB-231 motile cells.

Engineering related neutron diffraction measurements probing strains, texture and microstructure

Energy Technology Data Exchange (ETDEWEB)

Clausen, Bjorn [Los Alamos National Laboratory; Brown, Donald W [Los Alamos National Laboratory; Tome, Carlos N [Los Alamos National Laboratory; Balogh, Levente [Los Alamos National Laboratory; Vogel, Sven C [Los Alamos National Laboratory

2010-01-01

Neutron diffraction has been used for engineering applications for nearly three decades. The basis of the technique is powder diffraction following Bragg's Law. From the measured diffraction patterns information about internal, or residual, strain can be deduced from the peak positions, texture information can be extracted from the peak intensities, and finally the peak widths can provide information about the microstructure, e.g. dislocation densities and grain sizes. The strains are measured directly from changes in lattice parameters, however, in many cases it is non-trivial to determine macroscopic values of stress or strain from the measured data. The effects of intergranular strains must be considered, and combining the neutron diffraction measurements with polycrystal deformation modeling has proven invaluable in determining the overall stress and strain values of interest in designing and dimensioning engineering components. Furthelmore, the combined use of measurements and modeling has provided a tool for elucidating basic material properties, such as critical resolved shear stresses for the active deformation modes and their evolution as a function of applied deformation.

Use of synchrotron-based diffraction-enhanced imaging for visualization of soft tissues in invertebrates

International Nuclear Information System (INIS)

Rao, Donepudi V.; Swapna, Medasani; Cesareo, Roberto; Brunetti, Antonio; Zhong, Zhong; Akatsuka, Takao; Yuasa, Tetsuya; Takeda, Tohoru; Gigante, Giovanni E.

2010-01-01

Images of terrestrial and marine invertebrates (snails and bivalves) have been obtained by using an X-ray phase-contrast imaging technique, namely, synchrotron-based diffraction-enhanced imaging. Synchrotron X-rays of 20, 30 and 40 keV were used, which penetrate deep enough into animal soft tissues. The phase of X-ray photons shifts slightly as they traverse an object, such as animal soft tissue, and interact with its atoms. Biological features, such as shell morphology and animal physiology, have been visualized. The contrast of the images obtained at 40 keV is the best. This optimum energy provided a clear view of the internal structural organization of the soft tissue with better contrast. The contrast is higher at edges of internal soft-tissue structures. The image improvements achieved with the diffraction-enhanced imaging technique are due to extinction, i.e., elimination of ultra-small-angle scattering. They enabled us to identify a few embedded internal shell features, such as the origin of the apex, which is the firmly attached region of the soft tissue connecting the umbilicus to the external morphology. Diffraction-enhanced imaging can provide high-quality images of soft tissues valuable for biology.

Use of synchrotron-based diffraction-enhanced imaging for visualization of soft tissues in invertebrates

Energy Technology Data Exchange (ETDEWEB)

Rao, Donepudi V., E-mail: donepudi_venkateswararao@rediffmail.co [Istituto di Matematica e Fisica, Universita degli Studi di Sassari, Via Vienna 2, 07100 Sassari (Italy); Swapna, Medasani, E-mail: medasanisw@gmail.co [Istituto di Matematica e Fisica, Universita degli Studi di Sassari, Via Vienna 2, 07100 Sassari (Italy); Cesareo, Roberto; Brunetti, Antonio [Istituto di Matematica e Fisica, Universita degli Studi di Sassari, Via Vienna 2, 07100 Sassari (Italy); Zhong, Zhong [National Synchrotron Light Source, Brookhaven National Laboratory, Upton, NY 11973 (United States); Akatsuka, Takao; Yuasa, Tetsuya [Department of Bio-System Engineering, Faculty of Engineering, Yamagata University, Yonezawa-shi, Yamagata-992-8510 (Japan); Takeda, Tohoru [Allied Health Science, Kitasato University 1-15-1 Kitasato, Sagamihara, Kanagawa 228-8555 (Japan); Gigante, Giovanni E. [Dipartimento di Fisica, Universita di Roma, La Sapienza, 00185 Roma (Italy)

2010-09-15

Images of terrestrial and marine invertebrates (snails and bivalves) have been obtained by using an X-ray phase-contrast imaging technique, namely, synchrotron-based diffraction-enhanced imaging. Synchrotron X-rays of 20, 30 and 40 keV were used, which penetrate deep enough into animal soft tissues. The phase of X-ray photons shifts slightly as they traverse an object, such as animal soft tissue, and interact with its atoms. Biological features, such as shell morphology and animal physiology, have been visualized. The contrast of the images obtained at 40 keV is the best. This optimum energy provided a clear view of the internal structural organization of the soft tissue with better contrast. The contrast is higher at edges of internal soft-tissue structures. The image improvements achieved with the diffraction-enhanced imaging technique are due to extinction, i.e., elimination of ultra-small-angle scattering. They enabled us to identify a few embedded internal shell features, such as the origin of the apex, which is the firmly attached region of the soft tissue connecting the umbilicus to the external morphology. Diffraction-enhanced imaging can provide high-quality images of soft tissues valuable for biology.

Neutron diffraction search for the charge density waves in early rare earth metal deuterides RD/sub 3/ (R = La, Ce)

Energy Technology Data Exchange (ETDEWEB)

Alikhanov, R A; Buzin, V I; Kulikov, N I [AN SSSR, Moscow. Inst. Fiziki Vysokikh Davlenij; Kost, M E [Institute of General and Inorganic Chemistry, Academy of Sciences of the USSR, Moscow (USSR); Sikora, W [Joint Inst. for Nuclear Research, Dubna (USSR); Smirnov, L S [Institute of Theoretical and Experimental Physics, Moscow (USSR)

1984-08-01

The results of neutron diffraction measurements performed on CeDsub(x) near the trihydride composition MeD/sub 3/ at room temperature and on LaDsub(2.9) at liquid nitrogen and room temperatures are presented. Superstructure reflections have been found. The system of additional reflections in lanthanum deuteride is different from that in cerium deuteride. The concentration and temperature boundaries for the transformed phases are reported. The experimental results are discussed on the basis of Kulikov's excitonic dielectric model for metal-to-semiconductor phase transitions. The determination of crystal structures from experimental neutron diffraction patterns is discussed.

Diamond Thermal Expansion Measurement Using Transmitted X-ray Back-diffraction.

OpenAIRE

Giles, Carlos; Adriano, Cris; Lubambo, Adriana Freire; Cusatis, Cesar; Mazzaro, Irineu; Hönnicke, Marcelo Goncalves

2015-01-01

The linear thermal expansion coefficient of diamond has been measured using forward-diffracted profiles in X-ray backscattering. This experimental technique is presented as an alternative way of measuring thermal expansion coefficients of solids in the high-resolution Bragg backscattering geometry without the intrinsic difficulty of detecting the reflected beam. The temperature dependence of the lattice parameter is obtained from the high sensitivity of the transmitted profiles to the Bragg a...

Characterisation of polycrystal deformation by numerical modelling and neutron diffraction measurements

International Nuclear Information System (INIS)

Clausen, B.

1997-09-01

The deformation of polycrystals are modelled using three micron mechanic models; the Taylor model, the Sachs model and Hutchinson's self-consistent (SC) model. The predictions of the rigid plastic Taylor and Sachs models are compared with the predictions of the SC model. As expected, the results of the SC model is about half-way between the upper- and lower-bound models. The influence of the elastic anisotropy is investigated by comparing the SC predictions for aluminium, copper and a hypothetical material (Hybrid) with the elastic anisotropy of copper and the Young's modulus and hardening behaviour of aluminium. It is concluded that the effect of the elastic anisotropy is limited to the very early stages of plasticity, as the deformation pattern is almost identical for the three materials at higher strains. The predictions of the three models are evaluated by neutron diffraction measurements of elastic lattice strains in grain sub-sets within the polycrystal. The two rigid plastic models do not include any material parameters and therefore the predictions of the SC model is more accurate and more detailed than the predictions of the Taylor and Sachs models. The SC model is used to determine the most suitable reflection for technological applications of neutron diffraction, where focus is on the volume average stress state in engineering components. To be able to successfully to convert the measured elastic lattice strains for a specific reflection into overall volume average stresses, there must be a linear relation between the lattice strain of the reflection and the overall stress. According to the model predictions the 311-reflection is the most suitable reflection as it shows the smallest deviations from linearity and thereby also the smallest build-up of residual strains. The model predictions have pin pointed that the selection of the reflection is crucial for the validity of stresses calculated from the measured elastic lattice strains. (au) 14 tabs., 41

Direct observation of ultrafast atomic motion using time-resolved X-ray diffraction

Energy Technology Data Exchange (ETDEWEB)

Shymanovich, U.

2007-11-13

This thesis is dedicated to the study of the atomic motion in laser irradiated solids on a picosecond to subpicosecond time-scale using the time-resolved X-ray diffraction technique. In the second chapter, the laser system, the laser-plasma based X-ray source and the experimental setup for optical pump / X-ray probe measurements were presented. Chapter 3 is devoted to the characterization and comparison of different types of X-ray optics. Chapter 4 presented the time-resolved X-ray diffraction experiments performed for this thesis. The first two sections of this chapter discuss the measurements of initially unexpected strain-induced transient changes of the integrated reflectivity of the X-ray probe beam. The elimination of the strain-induced transient changes of the integrated reflectivity represented an important prerequisite to perform the study of lattice heating in Germanium after femtosecond optical excitation by measuring the transient Debye-Waller effect. The third section describes the investigations of acoustic waves upon ultrafast optical excitation and discusses the two different pressure contributions driving them: the thermal and the electronic ones. (orig.)

Direct observation of ultrafast atomic motion using time-resolved X-ray diffraction

International Nuclear Information System (INIS)

Shymanovich, U.

2007-01-01

This thesis is dedicated to the study of the atomic motion in laser irradiated solids on a picosecond to subpicosecond time-scale using the time-resolved X-ray diffraction technique. In the second chapter, the laser system, the laser-plasma based X-ray source and the experimental setup for optical pump / X-ray probe measurements were presented. Chapter 3 is devoted to the characterization and comparison of different types of X-ray optics. Chapter 4 presented the time-resolved X-ray diffraction experiments performed for this thesis. The first two sections of this chapter discuss the measurements of initially unexpected strain-induced transient changes of the integrated reflectivity of the X-ray probe beam. The elimination of the strain-induced transient changes of the integrated reflectivity represented an important prerequisite to perform the study of lattice heating in Germanium after femtosecond optical excitation by measuring the transient Debye-Waller effect. The third section describes the investigations of acoustic waves upon ultrafast optical excitation and discusses the two different pressure contributions driving them: the thermal and the electronic ones. (orig.)

Reflection characterization of nano-sized dielectric structure in Morpho butterfly wings

Science.gov (United States)

Zhu, Dong

2017-10-01

Morpho butterflies living in Central and South America are well-known for their structural-colored blue wings. The blue coloring originates from the interaction of light with nano-sized dielectric structures that are equipped on the external surface of scales covering over their wings. The high-accuracy nonstandard finite-difference time domain (NS-FDTD) method is used to investigate the reflection characterization from the nanostructures. In the NS-FDTD calculation, a computational model is built to mimic the actual tree-like multilayered structures wherever possible using the hyperbolic tangent functions. It is generally known that both multilayer interference and diffraction grating phenomena can occur when light enters the nano-sized multilayered structure. To answer the question that which phenomenon is mainly responsible for the blue coloring, the NS-FDTD calculation is performed under various incidence angles at wavelengths from 360 to 500 nm. The calculated results at one incident wavelength under different incidence angles are visualized in a two-dimensional mapping image, where horizontal and vertical axes are incidence and reflection angles, respectively. The images demonstrate a remarkable transition from a ring-like pattern at shorter wavelengths to a retro-reflection pattern at longer wavelengths. To clarify the origin of the pattern transition, the model is separated into several simpler parts and compared their mapping images with the theoretical diffraction calculations. It can be concluded that the blue coloring at longer wavelengths is mainly caused by the cooperation of multilayer interference and retro-reflection while the effect of diffraction grating is predominant at shorter wavelengths.

Controllable reflection of X-rays on crystals of saccharose

CERN Document Server

Navasardyan, M A; Hayrapetyan, K T; Gabrielyan, R T

2003-01-01

Multiple (ten times and more) increase in intensities of separate reflections and of lauegram reflections from organic single crystals of saccharose (C sub 1 2H sub 2 2O sub 1 1) was observed under influence of certain temperature gradient. On the base of the present experiment and the data of our previous woks we show that the controllable reflection process has a common nature and the intensity of the diffracted beam under external influences does not depend on the total number of electrons per unit volume of the unit cell of the single crystal.

Dynamic grazing incidence fast atom diffraction during molecular beam epitaxial growth of GaAs

Energy Technology Data Exchange (ETDEWEB)

Atkinson, P., E-mail: atkinson@insp.jussieu.fr; Eddrief, M. [Sorbonne Universités, UPMC Univ. Paris 06, UMR 7588, INSP, F-75005 Paris (France); CNRS, UMR 7588, Institut des NanoSciences de Paris, 4 place Jussieu, F-75005 Paris (France); Etgens, V. H. [CNRS, UMR 7588, Institut des NanoSciences de Paris, 4 place Jussieu, F-75005 Paris (France); VeDeCom-Université Versailles Saint-Quentin en Yvelines, Versailles (France); Khemliche, H., E-mail: hocine.khemliche@u-psud.fr; Debiossac, M.; Mulier, M.; Lalmi, B.; Roncin, P. [ISMO UMR8214 CNRS-Université Paris-Sud, Orsay F-91400 (France); Momeni, A. [ISMO UMR8214 CNRS-Université Paris-Sud, Orsay F-91400 (France); Univ. Cergy Pontoise, F-95031 Cergy (France)

2014-07-14

A Grazing Incidence Fast Atom Diffraction (GIFAD) system has been mounted on a commercial molecular beam epitaxy chamber and used to monitor GaAs growth in real-time. In contrast to the conventionally used Reflection High Energy Electron Diffraction, all the GIFAD diffraction orders oscillate in phase, with the change in intensity related to diffuse scattering at step edges. We show that the scattered intensity integrated over the Laue circle is a robust method to monitor the periodic change in surface roughness during layer-by-layer growth, with oscillation phase and amplitude independent of incidence angle and crystal orientation. When there is a change in surface reconstruction at the start of growth, GIFAD intensity oscillations show that there is a corresponding delay in the onset of layer-by-layer growth. In addition, changes in the relative intensity of different diffraction orders have been observed during growth showing that GIFAD has the potential to provide insight into the preferential adatom attachment sites on the surface reconstruction during growth.

X-ray diffraction without sample preparation: Proof-of-principle experiments

International Nuclear Information System (INIS)

Hansford, Graeme M.

2013-01-01

The properties of a novel X-ray diffraction (XRD) technique having very low sensitivity to the sample morphology were previously elucidated through theoretical considerations and model simulations (Hansford, 2011). This technique opens up the possibility of mineralogical analysis by XRD without sample preparation. Here, the results of proof-of-principle experimental tests are presented. Two sets of experiments were performed using a vacuum chamber equipped with an X-ray tube source, sample holder and charge-coupled detector. Firstly, a pressed-powder pellet of α-quartz was placed in three different positions relative to the X-ray source and detector. The changes in position represent gross sample movements which would be inconceivable in conventional XRD analysis. The resulting back-reflection energy-dispersive spectra show a very high degree of correspondence other than an overall intensity factor dependent on the distance between the sample and detector. Secondly, the back-reflection spectrum of an unprepared limestone hand specimen, having mm-scale surface morphology, was compared to the spectrum of a calcite pressed-powder pellet. The correspondence of the diffraction peaks in the spectra demonstrate that the limestone is comprised dominantly of calcite. In both cases, the claims of the earlier paper are fully supported by the results of these experimental tests. -- Highlights: • Proof-of-principle tests of a novel X-ray diffraction (XRD) method were conducted. • Very low sensitivity to sample position and orientation was demonstrated. • Insensitivity to sample morphology is inferred. • A simple analysis of an unprepared limestone hand specimen was performed. • This technique enables mineralogical analysis by XRD without sample preparation

How Is Buddhism Relevant to Career Counseling in an International High School in Hong Kong? A Counsellor's Reflection

Science.gov (United States)

Ng, Vinci; Yuen, Mantak

2015-01-01

This paper reflects upon the relevance of Buddhism to counselling in general and to career counseling in particular by discussing a program implemented at an international school in Hong Kong. The authors provide an analysis of the pertinent literature related to relevant concepts within Buddhism. This topic has not yet been adequately researched…

Influence of external actions on the Bragg-Laue diffraction of X-Rays

CERN Document Server

Gasparyan, L G; Grigoryan, A G

2000-01-01

The Bragg-Laue diffraction in finite size crystals under the influence of external actions (ultrasound, temperature gradient) is investigated experimentally. It is established that external actions ''charge for the worse'' the crystal quality, which leads to the broadening of the rocking curves and to the sharp decrease of intensity in the center of the reflection angular range.

Phase sensitive diffraction sensor for high sensitivity refractive index measurement

Science.gov (United States)

Kumawat, Nityanand; Varma, Manoj; Kumar, Sunil

2018-02-01

In this study a diffraction based sensor has been developed for bio molecular sensing applications and performing assays in real time. A diffraction grating fabricated on a glass substrate produced diffraction patterns both in transmission and reflection when illuminated by a laser diode. We used zeroth order I(0,0) as reference and first order I(0,1) as signal channel and conducted ratiometric measurements that reduced noise by more than 50 times. The ratiometric approach resulted in a very simple instrumentation with very high sensitivity. In the past, we have shown refractive index measurements both for bulk and surface adsorption using the diffractive self-referencing approach. In the current work we extend the same concept to higher diffraction orders. We have considered order I(0,1) and I(1,1) and performed ratiometric measurements I(0,1)/I(1,1) to eliminate the common mode fluctuations. Since orders I(0,1) and I(1,1) behaved opposite to each other, the resulting ratio signal amplitude increased more than twice compared to our previous results. As a proof of concept we used different salt concentrations in DI water. Increased signal amplitude and improved fluid injection system resulted in more than 4 times improvement in detection limit, giving limit of detection 1.3×10-7 refractive index unit (RIU) compared to our previous results. The improved refractive index sensitivity will help significantly for high sensitivity label free bio sensing application in a very cost-effective and simple experimental set-up.

Doppleron resonances in the diffraction of atoms by an evanescent field

International Nuclear Information System (INIS)

Murphy, J.E.; Hollenberg, L.C.L.; Smith, A.E.

1994-01-01

The diffracted intensities of sodium atoms by a standing evanescent light wave near the three doppleron resonance are calculated using a multi-slice technique. This calculation predicts a sharp dip in the reflected intensity of the specular beam for a detuning slightly below resonance. Such phenomena has been observed experimentally and can be understood using the dressed state picture. 4 refs., 2 tabs., 3 figs

Widefield and total internal reflection fluorescent structured illumination microscopy with scanning galvo mirrors

Science.gov (United States)

Chen, Youhua; Cao, Ruizhi; Liu, Wenjie; Zhu, Dazhao; Zhang, Zhiming; Kuang, Cuifang; Liu, Xu

2018-04-01

We present an alternative approach to realize structured illumination microscopy (SIM), which is capable for live cell imaging. The prototype utilizes two sets of scanning galvo mirrors, a polarization converter and a piezo-platform to generate a fast shifted, s-polarization interfered and periodic variable illumination patterns. By changing the angle of the scanning galvanometer, we can change the position of the spots at the pupil plane of the objective lens arbitrarily, making it easy to switch between widefield and total internal reflection fluorescent-SIM mode and adapting the penetration depth in the sample. Also, a twofold resolution improvement is achieved in our experiments. The prototype offers more flexibility of pattern period and illumination orientation changing than previous systems.

Formation of InAs/GaAs quantum dots from a subcritical InAs wetting layer: A reflection high-energy electron diffraction and theoretical study

International Nuclear Information System (INIS)

Song, H. Z.; Usuki, T.; Nakata, Y.; Yokoyama, N.; Sasakura, H.; Muto, S.

2006-01-01

InAs/GaAs quantum dots (QD's) are formed by postgrowth annealing of an InAs wetting layer thinner than the critical thickness for the transition from two- (2D) to three-dimensional (3D) growth mode. Reflection high energy electron diffraction is used to monitor the QD formation. Based on a mean-field theory [Phys. Rev. Lett. 79, 897 (1997)], the time evolution of total QD's volume, first increasing and finally saturating, is well explained by precursors forming during wetting layer growth and converting into nucleated QD's after growth stop. Both the saturation QD's volume and the QD nucleation rate depend exponentially on the InAs coverage. These behaviors and their temperature and InAs growth rate dependences are essentially understandable in the frame of the mean-field theory. Similar analysis to conventional QD growth suggests that the often observed significant mass transport from wetting layer to QD's can be ascribed to the precursors existing before 2D-3D growth mode transition

The diffractive achromat full spectrum computational imaging with diffractive optics

KAUST Repository

Peng, Yifan

2016-07-11

Diffractive optical elements (DOEs) have recently drawn great attention in computational imaging because they can drastically reduce the size and weight of imaging devices compared to their refractive counterparts. However, the inherent strong dispersion is a tremendous obstacle that limits the use of DOEs in full spectrum imaging, causing unacceptable loss of color fidelity in the images. In particular, metamerism introduces a data dependency in the image blur, which has been neglected in computational imaging methods so far. We introduce both a diffractive achromat based on computational optimization, as well as a corresponding algorithm for correction of residual aberrations. Using this approach, we demonstrate high fidelity color diffractive-only imaging over the full visible spectrum. In the optical design, the height profile of a diffractive lens is optimized to balance the focusing contributions of different wavelengths for a specific focal length. The spectral point spread functions (PSFs) become nearly identical to each other, creating approximately spectrally invariant blur kernels. This property guarantees good color preservation in the captured image and facilitates the correction of residual aberrations in our fast two-step deconvolution without additional color priors. We demonstrate our design of diffractive achromat on a 0.5mm ultrathin substrate by photolithography techniques. Experimental results show that our achromatic diffractive lens produces high color fidelity and better image quality in the full visible spectrum. © 2016 ACM.

Restoration of diffracted far field at the output of circular diffraction waveplate

International Nuclear Information System (INIS)

Hovhannisyan, D; Margaryan, H; Abrahamyan, V; Hakobyan, N; Tabiryan, N

2014-01-01

The light propagation in an anisotropic periodic media, such us circular diffraction waveplate (CDW) by a finite-difference time-domain (FDTD) technique is studied. The FDTD numerical simulation and the subsequent Fourier transform of the diffracted electric near field was been used for study of ability of CDW to diffract a laser beam and simultaneously convert polarization state. The FDTD simulation results used to restore the diffracted electric far field at the CDW output. an abstract

Overview of diffraction gratings technologies for spaceflight satellites and ground-based telescopes

Science.gov (United States)

Cotel, A.; Liard, A.; Desserouer, F.; Pichon, P.

2017-11-01

The diffraction gratings are widely used in Space-flight satellites for spectrograph instruments or in ground-based telescopes in astronomy. The diffraction gratings are one of the key optical components of such systems and have to exhibit very high optical performances. HORIBA Jobin Yvon S.A.S. (part of HORIBA Group) is in the forefront of such gratings development for more than 40 years. During the past decades, HORIBA Jobin Yvon (HJY) has developed a unique expertise in diffraction grating design and manufacturing processes for holographic, ruled or etched gratings. We will present in this paper an overview of diffraction grating technologies especially designed for space and astronomy applications. We will firstly review the heritage of the company in this field with the space qualification of different grating types. Then, we will describe several key grating technologies developed for specific space or astronomy projects: ruled blazed low groove density plane reflection grating, high-groove density holographic toroidal and spherical grating, and finally transmission Fused Silica Etched (FSE) grism-assembled grating. We will not present the Volume Phase Holographic (VPHG) grating type which is used in Astronomy.

The Uniform geometrical Theory of Diffraction for elastodynamics: Plane wave scattering from a half-plane.

Science.gov (United States)

Djakou, Audrey Kamta; Darmon, Michel; Fradkin, Larissa; Potel, Catherine

2015-11-01

Diffraction phenomena studied in electromagnetism, acoustics, and elastodynamics are often modeled using integrals, such as the well-known Sommerfeld integral. The far field asymptotic evaluation of such integrals obtained using the method of steepest descent leads to the classical Geometrical Theory of Diffraction (GTD). It is well known that the method of steepest descent is inapplicable when the integrand's stationary phase point coalesces with its pole, explaining why GTD fails in zones where edge diffracted waves interfere with incident or reflected waves. To overcome this drawback, the Uniform geometrical Theory of Diffraction (UTD) has been developed previously in electromagnetism, based on a ray theory, which is particularly easy to implement. In this paper, UTD is developed for the canonical elastodynamic problem of the scattering of a plane wave by a half-plane. UTD is then compared to another uniform extension of GTD, the Uniform Asymptotic Theory (UAT) of diffraction, based on a more cumbersome ray theory. A good agreement between the two methods is obtained in the far field.

Boundary diffraction wave integrals for diffraction modeling of external occulters

OpenAIRE

Cady, E.

2012-01-01

An occulter is a large diffracting screen which may be flown in conjunction with a telescope to image extrasolar planets. The edge is shaped to minimize the diffracted light in a region beyond the occulter, and a telescope may be placed in this dark shadow to view an extrasolar system with the starlight removed. Errors in position, orientation, and shape of the occulter will diffract additional light into this region, and a challenge of modeling an occulter system is to accurately and quickly...

Diffraction efficiency enhancement of femtosecond laser-engraved diffraction gratings due to CO2 laser polishing

International Nuclear Information System (INIS)

Choi, Hun-Kook; Jung, Deok; Sohn, Ik-Bu; Noh, Young-Chul; Lee, Yong-Tak; Kim, Jin-Tae; Ahsan, Shamim

2014-01-01

This research demonstrates laser-assisted fabrication of high-efficiency diffraction gratings in fused-silica glass samples. Initially, femtosecond laser pulses are used to engrave diffraction gratings on the glass surfaces. Then, these micro-patterned glass samples undergo CO 2 laser polishing process. unpolished diffraction gratings encoded in the glass samples show an overall diffraction efficiency of 18.1%. diffraction gratings imprinted on the glass samples and then polished four times by using a CO 2 laser beam attain a diffraction efficiency of 32.7%. We also investigate the diffraction patterns of the diffraction gratings encoded on fused-silica glass surfaces. The proposed CO 2 laser polishing technique shows great potential in patterning high-efficiency diffraction gratings on the surfaces of various transparent materials.

Energy loss from internal reflection off metal layers on glass

Science.gov (United States)

McDowell, M. W.; Bezuidenhout, D. F.; Klee, H. W.; Theron, E.

1983-12-01

The reflection characteristics of metal layers are considered for the situation where the electromagnetic radiation is incident from the glass side. Theoretical and measured reflectance values are presented which indicate that for some metals the reflection has a strong dependence on the refractive index of the incident medium. Some examples are given of recent cases where the above results were an important consideration in the choice of the metallic reflecting material. These results indicate that aluminium should not be automatically considered the best choice for the visible region nor gold for the infra-red.

Determination of surface tension coefficient of liquids by diffraction of light on capillary waves

International Nuclear Information System (INIS)

Nikolić, D; Nešić, Lj

2012-01-01

This paper describes a simple technique for determining the coefficient of the surface tension of liquids, based on laser light diffraction on capillary waves. Capillary waves of given frequency are created by an exciter needle acting on the surface of liquid and represent a reflective diffraction grating, the constant of which (the wavelength of capillary waves) can be determined based on a known incidence angle of light (grazing angle). We obtain the coefficient of the surface tension of liquids by applying the dispersion relation for capillary waves and analyze the difficulties that arise when setting up and conducting the experiment in detail. (paper)

Effect of end reflections on conversion efficiency of coaxial relativistic backward wave oscillator

Energy Technology Data Exchange (ETDEWEB)

Teng, Yan; Chen, Changhua; Sun, Jun; Shi, Yanchao; Ye, Hu; Wu, Ping; Li, Shuang; Xiong, Xiaolong [Science and Technology on High Power Microwave Laboratory, Northwest Institute of Nuclear Technology, Xi' an 710024 (China)

2015-11-07

This paper theoretically investigates the effect of end reflections on the operation of the coaxial relativistic backward wave oscillator (CRBWO). It is found that the considerable enhancement of the end reflection at one end increases the conversion efficiency, but excessively large end reflections at both ends weaken the asynchronous wave-beam interaction and thus reduce the conversion efficiency. Perfect reflection at the post end significantly improves the interaction between the electron beam and the asynchronous harmonic so that the conversion efficiency is notably increased. Based on the theoretical research, the diffraction-CRBWO with the generated microwave diffracted and output through the front end of the coaxial slow wave structure cavity is proposed. The post end is conductively closed to provide the perfect reflection. This promotes the amplitude and uniformity of the longitudinal electric field on the beam transmission line and improves the asynchronous wave-beam interaction. In numerical simulations under the diode voltage and current of 450 kV and 5.84 kA, microwave generation with the power of 1.45 GW and the conversion efficiency of 55% are obtained at the frequency of 7.45 GHz.

Quantitative damage imaging using Lamb wave diffraction tomography

International Nuclear Information System (INIS)

Zhang Hai-Yan; Ruan Min; Zhu Wen-Fa; Chai Xiao-Dong

2016-01-01

In this paper, we investigate the diffraction tomography for quantitative imaging damages of partly through-thickness holes with various shapes in isotropic plates by using converted and non-converted scattered Lamb waves generated numerically. Finite element simulations are carried out to provide the scattered wave data. The validity of the finite element model is confirmed by the comparison of scattering directivity pattern (SDP) of circle blind hole damage between the finite element simulations and the analytical results. The imaging method is based on a theoretical relation between the one-dimensional (1D) Fourier transform of the scattered projection and two-dimensional (2D) spatial Fourier transform of the scattering object. A quantitative image of the damage is obtained by carrying out the 2D inverse Fourier transform of the scattering object. The proposed approach employs a circle transducer network containing forward and backward projections, which lead to so-called transmission mode (TMDT) and reflection mode diffraction tomography (RMDT), respectively. The reconstructed results of the two projections for a non-converted S0 scattered mode are investigated to illuminate the influence of the scattering field data. The results show that Lamb wave diffraction tomography using the combination of TMDT and RMDT improves the imaging effect compared with by using only the TMDT or RMDT. The scattered data of the converted A0 mode are also used to assess the performance of the diffraction tomography method. It is found that the circle and elliptical shaped damages can still be reasonably identified from the reconstructed images while the reconstructed results of other complex shaped damages like crisscross rectangles and racecourse are relatively poor. (special topics)

Phase behavior in diffraction

International Nuclear Information System (INIS)

Checon, A.

1983-01-01

Theoretical formulation of a straight edge diffraction shows a phase difference of π/2 between the incoming and diffracted waves. Experiments using two straight edges do not confirm the π/2 difference but suggest that the incoming wave is in phase with the wave diffracted into the shadowed region of the edge and out of phase by a factor of π with the wave diffracted into the illuminated region. (Author) [pt

Incident spectrum determination for time-of-flight neutron powder diffraction data analysis

International Nuclear Information System (INIS)

Hodges, J. P.

1998-01-01

Accurate characterization of the incident neutron spectrum is an important requirement for precise Rietveld analysis of time-of-flight powder neutron diffraction data. Without an accurate incident spectrum the calculated model for the measured relative intensities of individual Bragg reflections will possess systematic errors. We describe a method for obtaining an accurate numerical incident spectrum using data from a transmitted beam monitor

Diffraction at TOTEM

OpenAIRE

Antchev, G.; Aspell, P.; Avati, V.; Bagliesi, M.G.; Berardi, V.; Berretti, M.; Bottigli, U.; Bozzo, M.; Brucken, E.; Buzzo, A.; Cafagna, F.; Calicchio, M.; Catanesi, M.G.; Catastini, P.L.; Cecchi, R.

2008-01-01

The TOTEM experiment at the LHC measures the total proton-proton cross section with the luminosity-independent method and the elastic proton-proton cross-section over a wide |t|-range. It also performs a comprehensive study of diffraction, spanning from cross-section measurements of individual diffractive processes to the analysis of their event topologies. Hard diffraction will be studied in collaboration with CMS taking advantage of the large common rapidity coverage for charged and neutral...

Benchmarking of HEU mental annuli critical assemblies with internally reflected graphite cylinder

Directory of Open Access Journals (Sweden)

Xiaobo Liu

2017-01-01

Full Text Available Three experimental configurations of critical assemblies, performed in 1963 at the Oak Ridge Critical Experiment Facility, which are assembled using three different diameter HEU annuli (15-9 inches, 15-7 inches and 13-7 inches metal annuli with internally reflected graphite cylinder are evaluated and benchmarked. The experimental uncertainties which are 0.00057, 0.00058 and 0.00057 respectively, and biases to the benchmark models which are − 0.00286, − 0.00242 and − 0.00168 respectively, were determined, and the experimental benchmark keff results were obtained for both detailed and simplified models. The calculation results for both detailed and simplified models using MCNP6-1.0 and ENDF/B-VII.1 agree well to the benchmark experimental results within difference less than 0.2%. The benchmarking results were accepted for the inclusion of ICSBEP Handbook.

Optical and x-ray alignment approaches for off-plane reflection gratings

Science.gov (United States)

Allured, Ryan; Donovan, Benjamin D.; DeRoo, Casey T.; Marlowe, Hannah R.; McEntaffer, Randall L.; Tutt, James H.; Cheimets, Peter N.; Hertz, Edward; Smith, Randall K.; Burwitz, Vadim; Hartner, Gisela; Menz, Benedikt

2015-09-01

Off-plane reflection gratings offer the potential for high-resolution, high-throughput X-ray spectroscopy on future missions. Typically, the gratings are placed in the path of a converging beam from an X-ray telescope. In the off-plane reflection grating case, these gratings must be co-aligned such that their diffracted spectra overlap at the focal plane. Misalignments degrade spectral resolution and effective area. In-situ X-ray alignment of a pair of off-plane reflection gratings in the path of a silicon pore optics module has been performed at the MPE PANTER beamline in Germany. However, in-situ X-ray alignment may not be feasible when assembling all of the gratings required for a satellite mission. In that event, optical methods must be developed to achieve spectral alignment. We have developed an alignment approach utilizing a Shack-Hartmann wavefront sensor and diffraction of an ultraviolet laser. We are fabricating the necessary hardware, and will be taking a prototype grating module to an X-ray beamline for performance testing following assembly and alignment.

Developement of a Light Attenuator Based on Glassy Reflections ...

African Journals Online (AJOL)

The light intensity control of a luminous source is a very important operation in many optical applications. Several types of light attenuator exploiting different optical phenomena like diffraction, absorption, and reflection exist and they differ principally in the maximum attenuation rate, the control range, the sensitivity and the ...

Diffraction at TOTEM

OpenAIRE

Giani, S; Niewiadomski, H; Antchev, G; Aspell, P; Avati, V; Bagliesi, M G; Berardi, V; Berretti, M; Besta, M; Bozzo, M; Brücken, E; Buzzo, A; Cafagna, F; Calicchio, M; Catanesi, M G

2010-01-01

The primary objective of the TOTEM experiment at the LHC is the measurement of the total proton-proton cross section with the luminosity-independent method and the study of elastic proton-proton cross-section over a wide |t|-range. In addition TOTEM also performs a comprehensive study of diffraction, spanning from cross-section measurements of individual diffractive processes to the analysis of their event topologies. Hard diffraction will be studied in collaboration with CMS taking advantage...

Parental reflective functioning as a moderator of child internalizing difficulties in the context of child sexual abuse.

Science.gov (United States)

Ensink, Karin; Bégin, Michaël; Normandin, Lina; Fonagy, Peter

2017-11-01

The objective was to examine pathways from child sexual abuse (CSA) and maternal mentalizing to child internalizing and externalizing difficulties and to test a model of MRF as a moderator of the relationships between CSA and child difficulties. The sample was comprised of 154 mothers and children aged 2-12 where 64 children had experienced CSA. To assess parental mentalizing the Parental Development Interview was rated with the Parental Reflective Functioning Scale. Child internalizing and externalizing difficulties were assessed with the Child Behavior Checklist (CBCL). Results indicate that there were significant inverse relationships between maternal mentalizing and child internalizing and externalizing difficulties. When maternal mentalizing was considered together with CSA, only maternal mentalizing was a significant predictor of child difficulties. Furthermore, maternal mentalizing moderated the relationship between CSA and child internalizing difficulties. These findings provide evidence of the importance of the parents' mentalizing stance for psychiatric symptoms of children aged 2-12, as well as children's recovery from CSA. The clinical implications of the findings are discussed. Copyright © 2017 Elsevier B.V. All rights reserved.

Study of the ferrimagnetic and paramagnetic phases of magnetite measured by multiple neutron diffraction

International Nuclear Information System (INIS)

Mazzocchi, V.L.

1992-01-01

Structural parameters of the ferrimagnetic and paramagnetic phases of magnetite have been refined from neutron multiple diffraction data. Experimental multiple diffraction patterns used in the refinement, were obtained by measuring the 111 primary reflection of a natural single crystal of this compound, at room temperature for the ferrimagnetic phase and 703 0 C for the paramagnetic phase. Corresponding theoretical patterns for both phases have been calculated by the program MULTI which uses the iterative method for the intensity calculations in neutron multiple diffraction. In this method intensities are calculated as Taylor series expansions summed up to a order sufficient for a good approximation. A step by step process has been used in the refinements according to the parameter-shift method. Both isotropic and anisotropic thermal parameters were used in the calculation of the temperature factor. (author)

Characterization of Brazilian asphalt using X-ray diffraction

International Nuclear Information System (INIS)

Cardoso, Edson R.; Pinto, Nivia G.V.; Almeida, Ana P.G.; Braz, Delson; Lopes, Ricardo T.; Barroso, Regina C.; Motta, Laura M.G.

2007-01-01

Asphalt is a sticky, black and highly viscous liquid or semi-solid that is presented in most crude petroleum and in some natural deposits. The X ray diffraction can give valuable information over the characteristics of a material. Thus, the X-ray diffraction (XRD) method was employed to investigate parameters that characterize and differentiate asphalt groups (Boscan, CAP20, CAP40, CAP50/60, CAP50/70 and CAP85/100). The scattering measurements were carried out in θ-2θ reflection geometry using a powder diffractometer Shimadzu XRD-6000 at the Nuclear Instrumentation Laboratory, Brazil. Scans were typically done from 8 deg to 28 deg every 0.05. The parameters analyzed were: FWHM, peak area, peak center, peak height, left half width and right half width. Thus, in this study, scattering profiles from different asphalt groups were carefully measured in order to establish characteristic signatures of these materials. The results indicate that by using three parameters (peak centroid, peak area and peak intensity) it is possible to characterize and differentiate the asphalt. (author)

Neutron diffraction measurements of residual stresses in NPP construction materials

International Nuclear Information System (INIS)

Hinca, R.; Bokuchava, G.

2001-01-01

Neutron diffraction is one of the most powerful methods for condensed matter studies. This method is used for non-destructive determination of residual stresses in material. The fundamental aspects of neutron diffraction are discussed, together with a brief description of the experimental facility. The principal advantage of using neutrons rather than the more conventional X-rays is the fact that neutron can penetrate deeply (2-4 cm for steel and more than 10 cm for aluminium) into metals to determine internal parameters within the bulk of materials. We present results of measurements residual stresses in NPP construction material - austenitic stainless steel (Cr-18%, Ni-10%, Ti-1%) coated with high-nickel alloy. (authors)

Packing stress reduction in polymer-lipid monolayers at the air-water interface: An X-ray grazing-incidence diffraction and reflectivity study

Energy Technology Data Exchange (ETDEWEB)

Kuhl, T.L.; Majewski, J.; Howes, P.B.; Kjaer, K.; Nahmen, A. von; Lee, K.Y.C.; Ocko, B.; Israelachvili, J.N.; Smith, G.S.

1999-08-25

Using synchrotron grazing-incidence X-ray diffraction (GIXD) and reflectivity (XR), the authors have determined the in-plane and out-of-plane structure of phospholipid monolayers at the air-water interface as a function of hydrophilic lipid headgroup size. Di-stearoyl-phosphatidyl-ethanolamine (DSPE) lipid monolayers were systematically modified by chemically grafting hydrophilic poly(ethylene glycol) (PEG) chains of MW = 90 g/mol (2 ethylene oxide, EO, units), MW = 350 g/mol (8 EO units), and MW = 750 g/mol (17 EO units) to the lipid headgroups. The monolayers were studied in the solid phase at a surface pressure of 42 mN/m. At these high lipid packing densities, the PEG chains are submerged in the water subphase. The increased packing stresses from these bulky polymer headgroups distort the unit cell and the in-plane packing modes of the monolayers, leading to large out-of-plane alterations and staggering of the lipid molecules. Surprisingly, a change in the molecular packing of the monolayer toward higher packing densities (lower area per molecule) was observed on increasing the PEG MW to 750 g/mol (17 EO units). This rearrangement of the monolayer structure may be due to a conformational change in the PEG chains.

Celebrating international collaboration: reflections on the first Virtual International Practice Development Conference

Directory of Open Access Journals (Sweden)

Moira Stephens

2016-11-01

Full Text Available This article reports on the first Virtual International Practice Development Conference, held in May 2015 to celebrate International Nurses Day. The article describes key aspects of its planning, offers a flavour of the event itself and sets out an evaluation, including learning points and recommendations to assist with planning similar events in the future. Central to our learning are: The need for practice developers to grasp skills in technology associated with virtual space The need to embrace virtual space itself as another means by which creative and communicative spaces can be established for active learning and practice development activities The potential advantages that international virtual engagement has over face-to-face national or international engagement The delivery of this virtual event made a significant international contribution to global practice development activity within the International Practice Development Collaborative and to enabling practice developers to connect and celebrate on a more global basis. Implications for practice: Virtual space technology skills can assist with sharing and translating practice development research, innovations and critical commentary Virtual space can provide an adjunct to creative and communicative learning spaces Global networking opportunities can be developed and enhanced through the use of virtual space technology Practice developers need to role model the use of virtual technologies

Diffraction efficiency enhancement of femtosecond laser-engraved diffraction gratings due to CO{sub 2} laser polishing

Energy Technology Data Exchange (ETDEWEB)

Choi, Hun-Kook [Gwangju Institute of Science and Technology, Gwangju (Korea, Republic of); Chosun University, Gwangju (Korea, Republic of); Jung, Deok; Sohn, Ik-Bu; Noh, Young-Chul; Lee, Yong-Tak [Gwangju Institute of Science and Technology, Gwangju (Korea, Republic of); Kim, Jin-Tae [Chosun University, Gwangju (Korea, Republic of); Ahsan, Shamim [Khulna University, Khulna (Bangladesh)

2014-11-15

This research demonstrates laser-assisted fabrication of high-efficiency diffraction gratings in fused-silica glass samples. Initially, femtosecond laser pulses are used to engrave diffraction gratings on the glass surfaces. Then, these micro-patterned glass samples undergo CO{sub 2} laser polishing process. unpolished diffraction gratings encoded in the glass samples show an overall diffraction efficiency of 18.1%. diffraction gratings imprinted on the glass samples and then polished four times by using a CO{sub 2} laser beam attain a diffraction efficiency of 32.7%. We also investigate the diffraction patterns of the diffraction gratings encoded on fused-silica glass surfaces. The proposed CO{sub 2} laser polishing technique shows great potential in patterning high-efficiency diffraction gratings on the surfaces of various transparent materials.

Diffraction by disordered polycrystalline fibers

International Nuclear Information System (INIS)

Stroud, W.J.; Millane, R.P.

1995-01-01

X-ray diffraction patterns from some polycrystalline fibers show that the constituent microcrystallites are disordered. The relationship between the crystal structure and the diffracted intensities is then quite complicated and depends on the precise kind and degree of disorder present. The effects of disorder on diffracted intensities must be included in structure determinations using diffraction data from such specimens. Theory and algorithms are developed here that allow the full diffraction pattern to be calculated for a disordered polycrystalline fiber made up of helical molecules. The model accommodates various kinds of disorder and includes the effects of finite crystallite size and cylindrical averaging of the diffracted intensities from a fiber. Simulations using these methods show how different kinds, or components, of disorder produce particular diffraction effects. General properties of disordered arrays of helical molecules and their effects on diffraction patterns are described. Implications for structure determination are discussed. (orig.)

Plasmonic metasurfaces for efficient phase control in reflection

DEFF Research Database (Denmark)

Pors, Anders Lambertus; Bozhevolnyi, Sergey I.

2013-01-01

nanobrick and nanocross elements allows one to fully control the phase of reflected light for two orthogonal polarizations simultaneously. The approach is exemplified by the design of a gradient birefringent metasurface that reflects two orthogonal polarization states into +2 and −3 diffraction order......We numerically study the optical properties of metal-insulator-metal resonators and metasurfaces, emphasizing the presence of gap-surface plasmon (GSP) resonances and their connection to the optical response. In relation to birefringent metal-backed metasurfaces, we show how a combination of metal......, respectively, with a reflectivity up to ∼ 80% and in a broad wavelength range around the design wavelength of 800 nm. Finally, we introduce the concept of metascatterers, which are wavelength-sized polarization-sensitive scatterers....

Effect of diffraction on stimulated Brillouin scattering from a single laser hot spot

International Nuclear Information System (INIS)

Eliseev, V.V.; Rozmus, W.; Tikhonchuk, V.T.; Capjack, C.E.

1996-01-01

A single laser hot spot in an underdense plasma is represented as a focused Gaussian laser beam. Stimulated Brillouin scattering (SBS) from such a Gaussian beam with small f/numbers 2-4 has been studied in a three-dimensional slab geometry. It is shown that the SBS reflectivity from a single laser hot spot is much lower than that predicted by a simple three wave coupling model because of the diffraction of the scattered light from the spatially localized ion acoustic wave. SBS gain per one Rayleigh length of the incident laser beam is proposed as a quantitative measure of this effect. Diffraction-limited SBS from a randomized laser beam is also discussed. copyright 1996 American Institute of Physics

The Scherrer equation and the dynamical theory of X-ray diffraction.

Science.gov (United States)

Muniz, Francisco Tiago Leitão; Miranda, Marcus Aurélio Ribeiro; Morilla Dos Santos, Cássio; Sasaki, José Marcos

2016-05-01

The Scherrer equation is a widely used tool to determine the crystallite size of polycrystalline samples. However, it is not clear if one can apply it to large crystallite sizes because its derivation is based on the kinematical theory of X-ray diffraction. For large and perfect crystals, it is more appropriate to use the dynamical theory of X-ray diffraction. Because of the appearance of polycrystalline materials with a high degree of crystalline perfection and large sizes, it is the authors' belief that it is important to establish the crystallite size limit for which the Scherrer equation can be applied. In this work, the diffraction peak profiles are calculated using the dynamical theory of X-ray diffraction for several Bragg reflections and crystallite sizes for Si, LaB6 and CeO2. The full width at half-maximum is then extracted and the crystallite size is computed using the Scherrer equation. It is shown that for crystals with linear absorption coefficients below 2117.3 cm(-1) the Scherrer equation is valid for crystallites with sizes up to 600 nm. It is also shown that as the size increases only the peaks at higher 2θ angles give good results, and if one uses peaks with 2θ > 60° the limit for use of the Scherrer equation would go up to 1 µm.

Diffraction at TOTEM

CERN Document Server

Giani, S; Antchev, G; Aspell, P; Avati, V; Bagliesi, M G; Berardi, V; Berretti, M; Besta, M; Bozzo, M; Brücken, E; Buzzo, A; Cafagna, F; Calicchio, M; Catanesi, M G; Cecchi, R; Ciocci, M A; Dadel, P; Deile, M; Dimovasili, E; Eggert, K; Eremin, V; Ferro, F; Fiergolski, A; García, F; Greco, V; Grzanka, L; Heino, J; Hildén, T; Kaspar, J; Kopal, J; Kundrát, V; Kurvinen, K; Lami, S; Latino, G; Lauhakangas, R; Leszko, R; Lippmaa, E; Lokajícek, M; Lo Vetere, M; Lucas Rodriguez, F; Macrí, M; Magazzù, G; Meucci, M; Minutoli, S; Notarnicola, G; Oliveri, E; Oljemark, F; Orava, R; Oriunno, M; Österberg, K; Pedreschi, E; Petäjäjärvi, J; Prochazka, J; Quinto, M; Radermacher, E; Radicioni, E; Ravotti, F; Rella, G; Robutti, E; Ropelewski, L; Rostkowski, M; Ruggiero, G; Rummel, A; Saarikko, H; Sanguinetti, G; Santroni, A; Scribano, A; Sette, G; Snoeys, W; Spinella, F; Ster, A; Taylor, C; Trummal, A; Turini, N; Whitmore, J; Wu, J; Zalewski, M

2010-01-01

The primary objective of the TOTEM experiment at the LHC is the measurement of the total proton-proton cross section with the luminosity-independent method and the study of elastic proton-proton cross-section over a wide |t|-range. In addition TOTEM also performs a comprehensive study of diffraction, spanning from cross-section measurements of individual diffractive processes to the analysis of their event topologies. Hard diffraction will be studied in collaboration with CMS taking advantage of the large common rapidity coverage for charged and neutral particle detection and the large variety of trigger possibilities even at large luminosities. TOTEM will take data under all LHC beam conditions including standard high luminosity runs to maximise its physics reach. This contribution describes the main features of the TOTEM diffractive physics programme including measurements to be made in the early LHC runs.

High accuracy subwavelength distance measurements: A variable-angle standing-wave total-internal-reflection optical microscope

International Nuclear Information System (INIS)

Haynie, A.; Min, T.-J.; Luan, L.; Mu, W.; Ketterson, J. B.

2009-01-01

We describe an extension of the total-internal-reflection microscopy technique that permits direct in-plane distance measurements with high accuracy (<10 nm) over a wide range of separations. This high position accuracy arises from the creation of a standing evanescent wave and the ability to sweep the nodal positions (intensity minima of the standing wave) in a controlled manner via both the incident angle and the relative phase of the incoming laser beams. Some control over the vertical resolution is available through the ability to scan the incoming angle and with it the evanescent penetration depth.

Analyzing shear band formation with high resolution X-ray diffraction

Energy Technology Data Exchange (ETDEWEB)

Pagan, Darren C.; Obstalecki, Mark; Park, Jun-Sang; Miller, Matthew P.

2018-04-01

Localization of crystallographic slip into shear bands during uniaxial compression of a copper single crystal is studied using very far-field high-energy diffraction microscopy (vff-HEDM). Diffracted intensity was collected in-situ as the crystal deformed using a unique mobile detector stage that provided access to multiple diffraction peaks with high-angular resolution. From the diffraction data, single crystal orientation pole figures (SCPFs) were generated and are used to track the evolution of the distribution of lattice orientation that develops as slip localizes. To aid the identification of 'signatures' of shear band formation and analyze the SCPF data, a model of slip-driven lattice reorientation within shear bands is introduced. Confidence is built in conclusions drawn from the SCPF data about the character of internal slip localization through comparisons with strain fields on the sample surface measured simultaneously using digital image correlation. From the diffraction data, we find that the active slip direction and slip plane are not directly aligned with the orientation of the shear bands that formed. In fact, by extracting the underlying slip system activity from the SCPF data, we show that intersecting shear bands measured on the surface of the sample arise from slip primarily on the same underlying single slip system. These new vff-HEDM results raise significant questions on the use of surface measurements for slip system activity estimation. (C) 2018 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

Non-diffractive waves

CERN Document Server

Hernandez-Figueroa, Hugo E; Recami, Erasmo

2013-01-01

This continuation and extension of the successful book ""Localized Waves"" by the same editors brings together leading researchers in non-diffractive waves to cover the most important results in their field and as such is the first to present the current state.The well-balanced presentation of theory and experiments guides readers through the background of different types of non-diffractive waves, their generation, propagation, and possible applications. The authors include a historical account of the development of the field, and cover different types of non-diffractive waves, including Airy

A uniform geometrical optics and an extended uniform geometrical theory of diffraction for evaluating high frequency EM fields near smooth caustics and composite shadow boundaries

Science.gov (United States)

Constantinides, E. D.; Marhefka, R. J.

1994-01-01

A uniform geometrical optics (UGO) and an extended uniform geometrical theory of diffraction (EUTD) are developed for evaluating high frequency electromagnetic (EM) fields within transition regions associated with a two and three dimensional smooth caustic of reflected rays and a composite shadow boundary formed by the caustic termination or the confluence of the caustic with the reflection shadow boundary (RSB). The UGO is a uniform version of the classic geometrical optics (GO). It retains the simple ray optical expressions of classic GO and employs a new set of uniform reflection coefficients. The UGO also includes a uniform version of the complex GO ray field that exists on the dark side of the smooth caustic. The EUTD is an extension of the classic uniform geometrical theory of diffraction (UTD) and accounts for the non-ray optical behavior of the UGO reflected field near caustics by using a two-variable transition function in the expressions for the edge diffraction coefficients. It also uniformly recovers the classic UTD behavior of the edge diffracted field outside the composite shadow boundary transition region. The approach employed for constructing the UGO/EUTD solution is based on a spatial domain physical optics (PO) radiation integral representation for the fields which is then reduced using uniform asymptotic procedures. The UGO/EUTD analysis is also employed to investigate the far-zone RCS problem of plane wave scattering from two and three dimensional polynomial defined surfaces, and uniform reflection, zero-curvature, and edge diffraction coefficients are derived. Numerical results for the scattering and diffraction from cubic and fourth order polynomial strips are also shown and the UGO/EUTD solution is validated by comparison to an independent moment method (MM) solution. The UGO/EUTD solution is also compared with the classic GO/UTD solution. The failure of the classic techniques near caustics and composite shadow boundaries is clearly

Borehole radar diffraction tomography

Energy Technology Data Exchange (ETDEWEB)

Cho, Seong Jun; Kim, Jung Ho; Yi, Myeong Jong; Chung, Seung Hwan; Lee, Hee Il [Korea Institute of Geology Mining and Materials, Taejon (Korea, Republic of)

1997-12-01

Tomography is widely used as imaging method for determining subsurface structure. Among the reconstruction algorithms for tomographic imaging, travel time tomography is almost applied to imaging subsurface. But isolated small body comparable with the wavelength could not be well recognized by travel time tomography. Other tomographic method are need to improve the imaging process. In the study of this year, diffraction tomography was investigated. The theory for diffraction tomography is based on the 1st-order Born approximation. Multisource holography, which is similar to Kirchihoff migration, is compared with diffraction tomography. To improve 1st-order Born diffraction tomography, two kinds of filter designed from multisource holography and 2-D green function, respectively, applied on the reconstructed image. The algorithm was tested for the numerical modeling data of which algorithm consists of the analytic computation of radar signal in transmitter and receiver regions and 2-D FDM scheme for the propagation of electromagnetic waves in media. The air-filled cavity model to show a typical diffraction pattern was applied to diffraction tomography imaging, and the result shows accurate location and area of cavity. But the calculated object function is not well matched the real object function, because the air-filled cavity model is not satisfied week scattered inhomogeneity for 1st born approximation, and the error term is included in estimating source wavelet from received signals. In spite of the object function error, the diffraction tomography assist for interpretation of subsurface as if conducted with travel time tomography. And the fracture model was tested, 1st born diffraction tomographic image is poor because of limited view angle coverage and violation of week scatter assumption, but the filtered image resolve the fracture somewhat better. The tested diffraction tomography image confirms effectiveness of filter for enhancing resolution. (author). 14

Standard test method for verifying the alignment of X-Ray diffraction instrumentation for residual stress measurement

CERN Document Server

American Society for Testing and Materials. Philadelphia

2010-01-01

1.1 This test method covers the preparation and use of a flat stress-free test specimen for the purpose of checking the systematic error caused by instrument misalignment or sample positioning in X-ray diffraction residual stress measurement, or both. 1.2 This test method is applicable to apparatus intended for X-ray diffraction macroscopic residual stress measurement in polycrystalline samples employing measurement of a diffraction peak position in the high-back reflection region, and in which the θ, 2θ, and ψ rotation axes can be made to coincide (see Fig. 1). 1.3 This test method describes the use of iron powder which has been investigated in round-robin studies for the purpose of verifying the alignment of instrumentation intended for stress measurement in ferritic or martensitic steels. To verify instrument alignment prior to stress measurement in other metallic alloys and ceramics, powder having the same or lower diffraction angle as the material to be measured should be prepared in similar fashion...

Unit-cell refinement from powder diffraction scans

International Nuclear Information System (INIS)

Pawley, G.S.

1981-01-01

A procedure for the refinement of the crystal unit cell from a powder diffraction scan is presented. In this procedure knowledge of the crystal structure is not required, and at the end of the refinement a list of indexed intensities is produced. This list may well be usable as the starting point for the application of direct methods. The problems of least-squares ill-conditioning due to overlapping reflections are overcome by constraints. An example using decafluorocyclohexene, C 6 F 10 , shows the quality of fit obtained in a case which may even be a false minimum. The method should become more relevant as powder scans of improved resolution become available, through the use of pulsed neutron sources. (Auth.)

Threefold rotational symmetry in hexagonally shaped core-shell (In,Ga)As/GaAs nanowires revealed by coherent X-ray diffraction imaging.

Science.gov (United States)

Davtyan, Arman; Krause, Thilo; Kriegner, Dominik; Al-Hassan, Ali; Bahrami, Danial; Mostafavi Kashani, Seyed Mohammad; Lewis, Ryan B; Küpers, Hanno; Tahraoui, Abbes; Geelhaar, Lutz; Hanke, Michael; Leake, Steven John; Loffeld, Otmar; Pietsch, Ullrich

2017-06-01

Coherent X-ray diffraction imaging at symmetric hhh Bragg reflections was used to resolve the structure of GaAs/In 0.15 Ga 0.85 As/GaAs core-shell-shell nanowires grown on a silicon (111) substrate. Diffraction amplitudes in the vicinity of GaAs 111 and GaAs 333 reflections were used to reconstruct the lost phase information. It is demonstrated that the structure of the core-shell-shell nanowire can be identified by means of phase contrast. Interestingly, it is found that both scattered intensity in the (111) plane and the reconstructed scattering phase show an additional threefold symmetry superimposed with the shape function of the investigated hexagonal nanowires. In order to find the origin of this threefold symmetry, elasticity calculations were performed using the finite element method and subsequent kinematic diffraction simulations. These suggest that a non-hexagonal (In,Ga)As shell covering the hexagonal GaAs core might be responsible for the observation.

Total internal reflection sum-frequency generation spectroscopy and dense gold nanoparticles monolayer: a route for probing adsorbed molecules

International Nuclear Information System (INIS)

Tourillon, Gerard; Dreesen, Laurent; Volcke, Cedric; Sartenaer, Yannick; Thiry, Paul A; Peremans, Andre

2007-01-01

We show that sum-frequency generation spectroscopy performed in the total internal reflection configuration (TIR-SFG) combined with a dense gold nanoparticles monolayer allows us to study, with an excellent signal to noise ratio and high signal to background ratio, the conformation of adsorbed molecules. Dodecanethiol (DDT) was used as probe molecules in order to assess the potentialities of the approach. An enhancement of more than one order of magnitude of the SFG signals arising from the adsorbed species is observed with the TIR geometry compared to the external reflection one while the SFG non-resonant contribution remains the same for both configurations. Although further work is required to fully understand the origin of the SFG process on nanoparticles, our work opens new possibilities for studying nanostructures

Switching waves dynamics in optical bistable cavity-free system at femtosecond laser pulse propagation in semiconductor under light diffraction

Science.gov (United States)

Trofimov, Vyacheslav A.; Egorenkov, Vladimir A.; Loginova, Maria M.

2018-02-01

We consider a propagation of laser pulse in a semiconductor under the conditions of an occurrence of optical bistability, which appears due to a nonlinear absorption of the semiconductor. As a result, the domains of high concentration of free charged particles (electrons and ionized donors) occur if an intensity of the incident optical pulse is greater than certain intensity. As it is well-known, that an optical beam must undergo a diffraction on (or reflection from) the domains boundaries. Usually, the beam diffraction along a coordinate of the optical pulse propagation does not take into account by using the slowly varying envelope approximation for the laser pulse interaction with optical bistable element. Therefore, a reflection of the beam from the domains with abrupt boundary does not take into account under computer simulation of the laser pulse propagation. However, the optical beams, reflected from nonhomogeneities caused by the domains of high concentration of free-charged particles, can essentially influence on a formation of switching waves in a semiconductor. We illustrate this statement by computer simulation results provided on the base of nonlinear Schrödinger equation and a set of PDEs, which describe an evolution of the semiconductor characteristics (concentrations of free-charged particles and potential of an electric field strength), and taking into account the longitudinal and transverse diffraction effects.

Near IR Scanning Angle Total Internal Reflection Raman Spectroscopy at Smooth Gold Films

Energy Technology Data Exchange (ETDEWEB)

McKee, Kristopher; Meyer, Matthew; Smith, Emily

2012-04-13

Total internal reflection (TIR) Raman and reflectivity spectra were collected for nonresonant analytes as a function of incident angle at sapphire or sapphire/smooth 50 nm gold interfaces using 785 nm excitation. For both interfaces, the Raman signal as a function of incident angle is well-modeled by the calculated interfacial mean square electric field (MSEF) relative to the incident field times the thickness of the layer being probed in the Raman measurement (D{sub RS}). The Raman scatter was reproducibly enhanced at the interface containing a gold film relative to the sapphire interface by a factor of 4.3–4.6 for aqueous pyridine or 2.2–3.7 for neat nitrobenzene, depending on the analyzed vibrational mode. The mechanism for the increased Raman signal is the enhanced MSEF at incident angles where propagating surface plasmons are excited in the metal film. The background from the TIR prism was reduced by 89–95% with the addition of the gold film, and the percent relative uncertainty in peak area was reduced from 15 to 1.7% for the 1347 cm–1 mode of nitrobenzene. Single monolayers of benzenethiol (S/N = 6.8) and 4-mercaptopyridine (S/N = 16.5) on gold films were measured by TIR Raman spectroscopy with 785 nm excitation (210 mW) without resonant enhancement in 1 min.

Diffractive optics for industrial and commercial applications

Energy Technology Data Exchange (ETDEWEB)

Turunen, J. [Joensuu Univ. (Finland); Wyrowski, F. [eds.] [Jena Univ. (Germany)

1997-12-31

The following topics were dealt with: diffractive optics, diffraction gratings, optical system design with diffractive optics, continuous-relief diffractive lenses and microlens arrays, diffractive bifocal intraocular lenses, diffractive laser resonators, diffractive optics for semiconductor lasers, diffractive elements for optical image processing, photorefractive crystals in optical measurement systems, subwavelenth-structured elements, security applications, diffractive optics for solar cells, holographic microlithography. 999 refs.

Diffraction at TOTEM

CERN Document Server

Antchev, G.; Avati, V.; Bagliesi, M.G.; Berardi, V.; Berretti, M.; Bottigli, U.; Bozzo, M.; Brucken, E.; Buzzo, A.; Cafagna, F.; Calicchio, M.; Catanesi, M.G.; Catastini, P.L.; Cecchi, R.; Ciocci, M.A.; Deile, M.; Dimovasili, E.; Eggert, K.; Eremin, V.; Ferro, F.; Garcia, F.; Giani, S.; Greco, V.; Heino, J.; Hilden, T.; Kaspar, J.; Kopal, J.; Kundrat, V.; Kurvinen, K.; Lami, S.; Latino, G.; Lauhakangas, R.; Lippmaa, E.; Lokajicek, M.; Lo Vetere, M.; Lucas Rodriguez, F.; Macri, M.; Magazzu, G.; Meucci, M.; Minutoli, S.; Niewiadomski, H.; Noschis, E.; Notarnicola, G.; Oliveri, E.; Oljemark, F.; Orava, R.; Oriunno, M.; Osterberg, K.; Palazzi, P.; Pedreschi, E.; Petajajarvi, J.; Quinto, M.; Radermacher, E.; Radicioni, E.; Ravotti, F.; Rella, G.; Robutti, E.; Ropelewski, L.; Ruggiero, G.; Rummel, A.; Saarikko, H.; Sanguinetti, G.; Santroni, A.; Scribano, A.; Sette, G.; Snoeys, W.; Spinella, F.; Squillacioti, P.; Ster, A.; Taylor, C.; Trummal, A.; Turini, N.; Whitmore, J.; Wu, J.

2009-01-01

The TOTEM experiment at the LHC measures the total proton-proton cross section with the luminosity-independent method and the elastic proton-proton cross-section over a wide |t|-range. It also performs a comprehensive study of diffraction, spanning from cross-section measurements of individual diffractive processes to the analysis of their event topologies. Hard diffraction will be studied in collaboration with CMS taking advantage of the large common rapidity coverage for charged and neutral particle detection and the large variety of trigger possibilities even at large luminosities. TOTEM will take data under all LHC beam conditions including standard high luminosity runs to maximize its physics reach. This contribution describes the main features of the TOTEM physics programme including measurements to be made in the early LHC runs. In addition, a novel scheme to extend the diffractive proton acceptance for high luminosity runs by installing proton detectors at IP3 is described.

Accurate diffraction data integration by the EVAL15 profile prediction method : Application in chemical and biological crystallography

NARCIS (Netherlands)

Xian, X.

2009-01-01

Accurate integration of reflection intensities plays an essential role in structure determination of the crystallized compound. A new diffraction data integration method, EVAL15, is presented in this thesis. This method uses the principle of general impacts to predict ab inito three-dimensional

An ultrahigh-vacuum apparatus for resonant diffraction experiments using soft x rays (hν=300-2000 eV)

International Nuclear Information System (INIS)

Takeuchi, T.; Chainani, A.; Takata, Y.; Tanaka, Y.; Oura, M.; Tsubota, M.; Senba, Y.; Ohashi, H.; Mochiku, T.; Hirata, K.; Shin, S.

2009-01-01

We have developed an ultrahigh-vacuum instrument for resonant diffraction experiments using polarized soft x rays in the energy range of hν=300-2000 eV at beamline BL17SU of SPring-8. The diffractometer consists of modified differentially pumped rotary feedthroughs for θ-2θ stages, a sample manipulator with motor-controlled x-y-z-, tilt (χ)-, and azimuth (φ)-axes, and a liquid helium flow-type cryostat for temperature dependent measurements between 30 and 300 K. Test results indicate that the diffractometer exhibits high reproducibility (better than 0.001 deg.) for a Bragg reflection of α-quartz 100 at a photon energy of hν=1950 eV. Typical off- and on-resonance Bragg reflections in the energy range of 530-1950 eV could be measured using the apparatus. The results show that x-ray diffraction experiments with energy-, azimuth-, and incident photon polarization-dependence can be reliably measured using soft x rays in the energy range of ∼300-2000 eV. The facility can be used for resonant diffraction experiments across the L-edge of transition metals, M-edge of lanthanides, and up to the Si K-edge of materials.

Development of a micromechanical pitch-tunable grating with reflective/transmissive dual working modes

International Nuclear Information System (INIS)

Yu, Yi-Ting; Yuan, Wei-Zheng; Li, Tai-Ping; Yan, Bin

2010-01-01

In this paper, a micromechanical pitch-tunable grating with the capability of working in both reflective and transmissive modes is developed by using the silicon-on-glass (SOG) process. At a voltage of 65 V, the grating period is measured to increase by 4.62%. A simple optical experiment is performed to demonstrate how the proposed grating works in both modes. Then, experiments to measure the change of the diffraction angle versus driving voltage in both reflective and transmissive modes are designed and carried out utilizing an area-arrayed charge-coupled device (CCD), and the results are in good agreement with the theoretical calculation. Discussions on the structural configuration and diffraction efficiency of the proposed grating are presented. The grating presented provides better flexibility in the design and development of application systems.

Natural and synthetic prion structure from X-ray fiber diffraction

Energy Technology Data Exchange (ETDEWEB)

Wille, Holger; Bian, Wen; McDonald, Michele; Kendall, Amy; Colby, David W.; Bloch, Lillian; Ollesch, Julian; Borovinskiy, Alexander L.; Cohen, Fred E.; Prusiner, Stanley B.; Stubbs, Gerald; (Vanderbilt); (UCSF)

2009-10-21

A conformational isoform of the mammalian prion protein (PrP{sup Sc}) is the sole component of the infectious pathogen that causes the prion diseases. We have obtained X-ray fiber diffraction patterns from infectious prions that show cross-{beta} diffraction: meridional intensity at 4.8 {angstrom} resolution, indicating the presence of {beta} strands running approximately at right angles to the filament axis and characteristic of amyloid structure. Some of the patterns also indicated the presence of a repeating unit along the fiber axis, corresponding to four {beta}-strands. We found that recombinant (rec) PrP amyloid differs substantially from highly infectious brain-derived prions, both in structure as demonstrated by the diffraction data, and in heterogeneity as shown by electron microscopy. In addition to the strong 4.8 {angstrom} meridional reflection, the recPrP amyloid diffraction is characterized by strong equatorial intensity at approximately 10.5 {angstrom}, absent from brain-derived prions, and indicating the presence of stacked {beta}-sheets. Synthetic prions recovered from transgenic mice inoculated with recPrP amyloid displayed structural characteristics and homogeneity similar to those of naturally occurring prions. The relationship between the structural differences and prion infectivity is uncertain, but might be explained by any of several hypotheses: only a minority of recPrP amyloid possesses a replication-competent conformation, the majority of recPrP amyloid has to undergo a conformational maturation to acquire replication competency, or inhibitory forms of recPrP amyloid interfere with replication during the initial transmission.

Neutron diffraction study of the formation of ordered antiphase domains in cubic titanium carbide TiC0.60

International Nuclear Information System (INIS)

Khidirov, I.; Parpiev, A. S.

2013-01-01

A series of superstructural reflections (described within the sp. gr. Fd3m) are found to be split into three symmetric parts in the neutron powder diffraction pattern of titanium carbide TiC 0.60 annealed at a temperature of 600°C. No splitting of superstructural reflections is observed in the neutron diffraction pattern of TiC 0.60 annealed at relatively high temperatures (780°C). This phenomenon can be explained by that fact that the ordering of carbon atoms at relatively high temperatures (780°C) is accompanied by the formation of randomly oriented rather large antiphase domains (APDs) (450 Å). At relatively low temperatures (600°C), stacking faults arise in the arrangement of partially ordered carbon atoms. In this case, relatively small ordered APDs (290 Å) are formed, along with disordered ones.

Abstracts of International Conference on Experimental and Computing Methods in High Resolution Diffraction Applied for Structure Characterization of Modern Materials - HREDAMM

International Nuclear Information System (INIS)

2004-01-01

The conference addressed all aspects of high resolution diffraction. The topics of meeting include advanced experimental diffraction methods and computer data analysis for characterization of modern materials as well as the progress and new achievements in high resolution diffraction (X-ray, electrons, neutrons). Application of these methods for characterization of modern materials are widely presented among the invited, oral and poster contributions

Phase inversion and frequency doubling of reflection high-energy electron diffraction intensity oscillations in the layer-by-layer growth of complex oxides

Science.gov (United States)

Mao, Zhangwen; Guo, Wei; Ji, Dianxiang; Zhang, Tianwei; Gu, Chenyi; Tang, Chao; Gu, Zhengbin; Nie*, Yuefeng; Pan, Xiaoqing

In situ reflection high-energy electron diffraction (RHEED) and its intensity oscillations are extremely important for the growth of epitaxial thin films with atomic precision. The RHEED intensity oscillations of complex oxides are, however, rather complicated and a general model is still lacking. Here, we report the unusual phase inversion and frequency doubling of RHEED intensity oscillations observed in the layer-by-layer growth of SrTiO3 using oxide molecular beam epitaxy. In contacts to the common understanding that the maximum(minimum) intensity occurs at SrO(TiO2) termination, respectively, we found that both maximum or minimum intensities can occur at SrO, TiO2, or even incomplete terminations depending on the incident angle of the electron beam, which raises a fundamental question if one can rely on the RHEED intensity oscillations to precisely control the growth of thin films. A general model including surface roughness and termination dependent mean inner potential qualitatively explains the observed phenomena, and provides the answer to the question how to prepare atomically and chemically precise surface/interfaces using RHEED oscillations for complex oxides. We thank National Basic Research Program of China (No. 11574135, 2015CB654901) and the National Thousand-Young-Talents Program.

Diffraction radiation from relativistic particles

CERN Document Server

Potylitsyn, Alexander Petrovich; Strikhanov, Mikhail Nikolaevich; Tishchenko, Alexey Alexandrovich

2010-01-01

This book deals with diffraction radiation, which implies the boundary problems of electromagnetic radiation theory. Diffraction radiation is generated when a charged particle moves in a vacuum near a target edge. Diffraction radiation of non-relativistic particles is widely used to design intense emitters in the cm wavelength range. Diffraction radiation from relativistic charged particles is important for noninvasive beam diagnostics and design of free electron lasers based on Smith-Purcell radiation which is diffraction radiation from periodic structures. Different analytical models of diffraction radiation and results of recent experimental studies are presented in this book. The book may also serve as guide to classical electrodynamics applications in beam physics and electrodynamics. It can be of great use for young researchers to develop skills and for experienced scientists to obtain new results.

Diffraction radiation from relativistic particles

International Nuclear Information System (INIS)

Potylitsyn, Alexander Petrovich; Ryazanov, Mikhail Ivanovich; Strikhanov, Mikhail Nikolaevich; Tishchenko, Alexey Alexandrovich

2010-01-01

This book deals with diffraction radiation, which implies the boundary problems of electromagnetic radiation theory. Diffraction radiation is generated when a charged particle moves in a vacuum near a target edge. Diffraction radiation of non-relativistic particles is widely used to design intense emitters in the cm wavelength range. Diffraction radiation from relativistic charged particles is important for noninvasive beam diagnostics and design of free electron lasers based on Smith-Purcell radiation which is diffraction radiation from periodic structures. Different analytical models of diffraction radiation and results of recent experimental studies are presented in this book. The book may also serve as guide to classical electrodynamics applications in beam physics and electrodynamics. It can be of great use for young researchers to develop skills and for experienced scientists to obtain new results. (orig.)

Diffractive DIS: Where are we?

International Nuclear Information System (INIS)

Nikolaev, N.N.

2001-01-01

A brief review of the modern QCD theory of diffractive DIS is given. The recent progress has been remarkably rapid, all the principal predictions from the color dipole approach to diffraction - the (Q 2 + m V 2 ) scaling, the pattern of SCHNC, shrinkage of the diffraction cone in hard diffractive DIS, the strong impact of longitudinal gluons in inclusive J/Ψ production at Tevatron - have been confirmed experimentally

Diffraction dissociation

International Nuclear Information System (INIS)

Abarbanel, H.

1972-01-01

An attempt is made to analyse the present theoretical situation in the field of diffraction scattering. Two not yet fully answered questions related with a typical diffraction process AB→CD, namely: what is the structure of the transition matrix elements, and what is the structure of the exchange mechanism responsible for the scattering, are formulated and various proposals for answers are reviewed. Interesting general statement that the products (-1)sup(J)P, where J and P are respectively spin and parity, is conserved at each vertex has been discussed. The exchange mechanism in diffractive scattering has been considered using the language of the complex J-plane as the most appropriate. The known facts about the exchange mechanism are recalled and several routs to way out are proposed. The idea to consider the moving pole and associated branch points as like a particle and the associated two and many particle unitarity cuts is described in more details. (S.B.)

Analysis of higher order harmonics with holographic reflection gratings

Science.gov (United States)

Mas-Abellan, P.; Madrigal, R.; Fimia, A.

2017-05-01

Silver halide emulsions have been considered one of the most energetic sensitive materials for holographic applications. Nonlinear recording effects on holographic reflection gratings recorded on silver halide emulsions have been studied by different authors obtaining excellent experimental results. In this communication specifically we focused our investigation on the effects of refractive index modulation, trying to get high levels of overmodulation that will produce high order harmonics. We studied the influence of the overmodulation and its effects on the transmission spectra for a wide exposure range by use of 9 μm thickness films of ultrafine grain emulsion BB640, exposed to single collimated beams using a red He-Ne laser (wavelength 632.8 nm) with Denisyuk configuration obtaining a spatial frequency of 4990 l/mm recorded on the emulsion. The experimental results show that high overmodulation levels of refractive index produce second order harmonics with high diffraction efficiency (higher than 75%) and a narrow grating bandwidth (12.5 nm). Results also show that overmodulation produce diffraction spectra deformation of the second order harmonic, transforming the spectrum from sinusoidal to approximation of square shape due to very high overmodulation. Increasing the levels of overmodulation of refractive index, we have obtained higher order harmonics, obtaining third order harmonic with diffraction efficiency (up to 23%) and narrowing grating bandwidth (5 nm). This study is the first step to develop a new easy technique to obtain narrow spectral filters based on the use of high index modulation reflection gratings.

Indexing amyloid peptide diffraction from serial femtosecond crystallography: new algorithms for sparse patterns

Energy Technology Data Exchange (ETDEWEB)

Brewster, Aaron S. [Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States); Sawaya, Michael R. [University of California, Los Angeles, CA 90095-1570 (United States); University of California, Los Angeles, CA 90095-1570 (United States); University of California, Los Angeles, CA 90095-1570 (United States); Rodriguez, Jose [University of California, Los Angeles, CA 90095-1570 (United States); University of California, Los Angeles, CA 90095-1570 (United States); Hattne, Johan; Echols, Nathaniel [Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States); McFarlane, Heather T. [University of California, Los Angeles, CA 90095-1570 (United States); University of California, Los Angeles, CA 90095-1570 (United States); Cascio, Duilio [University of California, Los Angeles, CA 90095-1570 (United States); University of California, Los Angeles, CA 90095-1570 (United States); University of California, Los Angeles, CA 90095-1570 (United States); Adams, Paul D. [Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States); University of California, Berkeley, CA 94720 (United States); Eisenberg, David S. [University of California, Los Angeles, CA 90095-1570 (United States); University of California, Los Angeles, CA 90095-1570 (United States); University of California, Los Angeles, CA 90095-1570 (United States); Sauter, Nicholas K., E-mail: nksauter@lbl.gov [Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States)

2015-02-01

Special methods are required to interpret sparse diffraction patterns collected from peptide crystals at X-ray free-electron lasers. Bragg spots can be indexed from composite-image powder rings, with crystal orientations then deduced from a very limited number of spot positions. Still diffraction patterns from peptide nanocrystals with small unit cells are challenging to index using conventional methods owing to the limited number of spots and the lack of crystal orientation information for individual images. New indexing algorithms have been developed as part of the Computational Crystallography Toolbox (cctbx) to overcome these challenges. Accurate unit-cell information derived from an aggregate data set from thousands of diffraction patterns can be used to determine a crystal orientation matrix for individual images with as few as five reflections. These algorithms are potentially applicable not only to amyloid peptides but also to any set of diffraction patterns with sparse properties, such as low-resolution virus structures or high-throughput screening of still images captured by raster-scanning at synchrotron sources. As a proof of concept for this technique, successful integration of X-ray free-electron laser (XFEL) data to 2.5 Å resolution for the amyloid segment GNNQQNY from the Sup35 yeast prion is presented.

Standard test method for determining the effective elastic parameter for X-ray diffraction measurements of residual stress

CERN Document Server

American Society for Testing and Materials. Philadelphia

1998-01-01

1.1 This test method covers a procedure for experimentally determining the effective elastic parameter, Eeff, for the evaluation of residual and applied stresses by X-ray diffraction techniques. The effective elastic parameter relates macroscopic stress to the strain measured in a particular crystallographic direction in polycrystalline samples. Eeff should not be confused with E, the modulus of elasticity. Rather, it is nominally equivalent to E/(1 + ν) for the particular crystallographic direction, where ν is Poisson's ratio. The effective elastic parameter is influenced by elastic anisotropy and preferred orientation of the sample material. 1.2 This test method is applicable to all X-ray diffraction instruments intended for measurements of macroscopic residual stress that use measurements of the positions of the diffraction peaks in the high back-reflection region to determine changes in lattice spacing. 1.3 This test method is applicable to all X-ray diffraction techniques for residual stress measurem...

Diamond beamline I07: a beamline for surface and interface diffraction.

Science.gov (United States)

Nicklin, Chris; Arnold, Tom; Rawle, Jonathan; Warne, Adam

2016-09-01

Beamline I07 at Diamond Light Source is dedicated to the study of the structure of surfaces and interfaces for a wide range of sample types, from soft matter to ultrahigh vacuum. The beamline operates in the energy range 8-30 keV and has two endstations. The first houses a 2+3 diffractometer, which acts as a versatile platform for grazing-incidence techniques including surface X-ray diffraction, grazing-incidence small- (and wide-) angle X-ray scattering, X-ray reflectivity and grazing-incidence X-ray diffraction. A method for deflecting the X-rays (a double-crystal deflector) has been designed and incorporated into this endstation, extending the surfaces that can be studied to include structures formed on liquid surfaces or at liquid-liquid interfaces. The second experimental hutch contains a similar diffractometer with a large environmental chamber mounted on it, dedicated to in situ ultrahigh-vacuum studies. It houses a range of complementary surface science equipment including a scanning tunnelling microscope, low-energy electron diffraction and X-ray photoelectron spectroscopy ensuring that correlations between the different techniques can be performed on the same sample, in the same chamber. This endstation allows accurate determination of well ordered structures, measurement of growth behaviour during molecular beam epitaxy and has also been used to measure coherent X-ray diffraction from nanoparticles during alloying.

Registration of T-2 mycotoxin with total internal reflection ellipsometry and QCM impedance methods.

Science.gov (United States)

Nabok, A V; Tsargorodskaya, A; Holloway, A; Starodub, N F; Gojster, O

2007-01-15

A sensitive optical method of total internal reflection ellipsometry (TIRE) in conjunction with immune assay approach was exploited for the registration of T-2 mycotoxin in a wide range of concentrations from 100 microg/ml down to 0.15 ng/ml. Association constants of 1.4x10(6) and 1.9x10(7)mol(-1)s for poly- and monoclonal T-2 antibodies, respectively, were evaluated from TIRE kinetic measurements. According to TIRE data fitting, binding of T-2 molecules to antibodies (at saturation) has resulted in the increase in adsorbed layer thickness of 4-5 nm. The QCM impedance measurements data showed anomalously large mass increase and film softening, most likely, due to the binding of large T-2 aggregates to antibodies.

A program for the derivation of crystal unit cell parameters from X-ray powder diffraction measurements

International Nuclear Information System (INIS)

Ferguson, I.F.; Rogerson, A.H.

1984-01-01

The program, FIRESTAR, determines the dimensions of a crystallographic unit cell from a set of X-ray powder diffraction measurements corresponding to a set of Bragg reflections, provided that the crystal system applicable is known and the Bragg reflections have been indexed. The program includes a range of possible extrapolation functions, and the data may be weighted. Provision is made for detecting and rejecting a single 'bad' measurement, and then rejecting measurements which lie outside an error limit set in the input data. (orig.)

Radial reflection diffraction tomography

Science.gov (United States)

Lehman, Sean K.

2012-12-18

A wave-based tomographic imaging method and apparatus based upon one or more rotating radially outward oriented transmitting and receiving elements have been developed for non-destructive evaluation. At successive angular locations at a fixed radius, a predetermined transmitting element can launch a primary field and one or more predetermined receiving elements can collect the backscattered field in a "pitch/catch" operation. A Hilbert space inverse wave (HSIW) algorithm can construct images of the received scattered energy waves using operating modes chosen for a particular application. Applications include, improved intravascular imaging, bore hole tomography, and non-destructive evaluation (NDE) of parts having existing access holes.

Single-crystal neutron diffraction study of ammonium nitrate phase III

International Nuclear Information System (INIS)

Choi, C.S.; Prask, H.J.

1982-01-01

The crystal structure of ammonium nitrate phase III has been studied at room temperature by neutron diffraction using a single crystal containing 5% KNO 3 in solid-solution form. The space group is Pnma, with a = 7.6772 (4), b = 5.8208 (4), c = 7.1396 (5) A, Z = 4. The final residual after full-matrix least-squares refinement was R = 0.042 for 348 observed reflections. The ammonium ions are thermally disordered into two orientations, displaced by an angle of approximately 42 0 about an axis parallel to the c axis. (Auth.)

Spot profile analysis and lifetime mapping in ultrafast electron diffraction: Lattice excitation of self-organized Ge nanostructures on Si(001

Directory of Open Access Journals (Sweden)

T. Frigge

2015-05-01

Full Text Available Ultrafast high energy electron diffraction in reflection geometry is employed to study the structural dynamics of self-organized Germanium hut-, dome-, and relaxed clusters on Si(001 upon femtosecond laser excitation. Utilizing the difference in size and strain state the response of hut- and dome clusters can be distinguished by a transient spot profile analysis. Surface diffraction from {105}-type facets provide exclusive information on hut clusters. A pixel-by-pixel analysis of the dynamics of the entire diffraction pattern gives time constants of 40, 160, and 390 ps, which are assigned to the cooling time constants for hut-, dome-, and relaxed clusters.

The use of pulsed neutron diffraction to measure strain in composites

International Nuclear Information System (INIS)

Bourke, M.A.M.; Goldstone, J.A.; Shi, N.; Gray, G.T. III; James, M.R.

1994-01-01

Neutron diffraction is a technique for measuring strain in crystalline materials. It is non destructive, phase discriminatory and more penetrating than X rays. Pulsed neutron sources (in contrast with steady state reactor sources) are particularly appropriate for examining heterogeneous materials or for recording the polycrystalline response of all lattice reflections. Several different aspects of composite behavior can be characterized and examples are given of residual strain measurements, strain relaxation during heating, applied loading, and determination of the strain distribution function

About some practical aspects of X-ray diffraction : From powder to thin film

Energy Technology Data Exchange (ETDEWEB)

Valvoda, V [Charles Univ. Prague (Czech Republic). Faculty of Mathematics and Physics

1996-09-01

Structure of thin films can be amorphous, polycrystalline or epitaxial, and the films can be prepared as a single layer films, multilayers or as graded films. A complete structure analysis of thin films by means of X-ray diffraction (XRD) usually needs more than one diffraction geometry to be used. Their principles, advantages and disadvantages will be shortly described, especially with respect to their different sampling depth and different response to orientation of diffracting crystallographic planes. Main differences in structure of thin films with respect to powder samples are given by a singular direction of their growth, by their adhesion to a substrate and often also by a simultaneous bombardment by atomic species during the growth. It means that a thermodynamically unstable atomic structures can be found too. These special features of growth of thin polycrystalline films are reflected in often found strong preferred orientation of grains and in residual stresses conserved in the films. The methods of structure analysis of thin films by XRD will be compared with other techniques which can supply structure images on different scales.

Liability for nuclear damage: an international perspective. Reflections on the revision of the Vienna Convention

Energy Technology Data Exchange (ETDEWEB)

Lopuski, J

1994-12-31

This book deals with deals of the complex issues of liability and compensation for nuclear damage which have been considered in the course of the work of the IAEA concerning the revision of the Vienna Convention on nuclear liability. It presents, in an orderly way, personal reflections of its author based on his experience gathered in years 1989-1992 when participating in this work. Necessarily it contains in some of its parts references to documents of the IAEA Standing Committee on Nuclear Liability; these documents because of their length could not be reproduced. Consequently these parts may not be fully intelligible for those who have not participated in or closely followed the Committee`s work. The IAEA work on liability for nuclear damage was initiated in the wake of the impact made on the world`s public opinion by the Chernobyl incident and its transboundary effects; issues of international state liability and full compensation have been raised. But humanitarian ideas have quickly been confronted with cold calculations of the cost of financial protection for victims and an open unwillingness of some nuclear states has been manifested. After three years of discussions no wide consensus could be reached on some basic issues, such as: relationship between international state and civil liability regimes, structure of international legislation, concept of nuclear damage, limits of compensation, role of public funds or jurisdiction. The author presents his approach to these controversial issue, trying to provide at the same time a theoretical outline for the future international legislation on nuclear liability. (author).

Liability for nuclear damage: an international perspective. Reflections on the revision of the Vienna Convention

Energy Technology Data Exchange (ETDEWEB)

Lopuski, J.

1993-12-31

This book deals with deals of the complex issues of liability and compensation for nuclear damage which have been considered in the course of the work of the IAEA concerning the revision of the Vienna Convention on nuclear liability. It presents, in an orderly way, personal reflections of its author based on his experience gathered in years 1989-1992 when participating in this work. Necessarily it contains in some of its parts references to documents of the IAEA Standing Committee on Nuclear Liability; these documents because of their length could not be reproduced. Consequently these parts may not be fully intelligible for those who have not participated in or closely followed the Committee`s work. The IAEA work on liability for nuclear damage was initiated in the wake of the impact made on the world`s public opinion by the Chernobyl incident and its transboundary effects; issues of international state liability and full compensation have been raised. But humanitarian ideas have quickly been confronted with cold calculations of the cost of financial protection for victims and an open unwillingness of some nuclear states has been manifested. After three years of discussions no wide consensus could be reached on some basic issues, such as: relationship between international state and civil liability regimes, structure of international legislation, concept of nuclear damage, limits of compensation, role of public funds or jurisdiction. The author presents his approach to these controversial issue, trying to provide at the same time a theoretical outline for the future international legislation on nuclear liability. (author).

Liability for nuclear damage: an international perspective. Reflections on the revision of the Vienna Convention

International Nuclear Information System (INIS)

Lopuski, J.

1993-01-01

This book deals with deals of the complex issues of liability and compensation for nuclear damage which have been considered in the course of the work of the IAEA concerning the revision of the Vienna Convention on nuclear liability. It presents, in an orderly way, personal reflections of its author based on his experience gathered in years 1989-1992 when participating in this work. Necessarily it contains in some of its parts references to documents of the IAEA Standing Committee on Nuclear Liability; these documents because of their length could not be reproduced. Consequently these parts may not be fully intelligible for those who have not participated in or closely followed the Committee's work. The IAEA work on liability for nuclear damage was initiated in the wake of the impact made on the world's public opinion by the Chernobyl incident and its transboundary effects; issues of international state liability and full compensation have been raised. But humanitarian ideas have quickly been confronted with cold calculations of the cost of financial protection for victims and an open unwillingness of some nuclear states has been manifested. After three years of discussions no wide consensus could be reached on some basic issues, such as: relationship between international state and civil liability regimes, structure of international legislation, concept of nuclear damage, limits of compensation, role of public funds or jurisdiction. The author presents his approach to these controversial issue, trying to provide at the same time a theoretical outline for the future international legislation on nuclear liability. (author)

Electron diffraction from carbon nanotubes

International Nuclear Information System (INIS)

Qin, L-C

2006-01-01

The properties of a carbon nanotube are dependent on its atomic structure. The atomic structure of a carbon nanotube can be defined by specifying its chiral indices (u, v), that specify its perimeter vector (chiral vector), with which the diameter and helicity are also determined. The fine electron beam available in a modern transmission electron microscope (TEM) offers a unique probe to reveal the atomic structure of individual nanotubes. This review covers two aspects related to the use of the electron probe in the TEM for the study of carbon nanotubes: (a) to understand the electron diffraction phenomena for inter-pretation of the electron diffraction patterns of carbon nanotubes and (b) to obtain the chiral indices (u, v), of the carbon nanotubes from the electron diffraction patterns. For a nanotube of a given structure, the electron scattering amplitude from the carbon nanotube is first described analytically in closed form using the helical diffraction theory. From a known structure as given by the chiral indices (u, v), its electron diffraction pattern can be calculated and understood. The reverse problem, i.e. assignment of the chiral indices from an electron diffraction pattern of a carbon nanotube, is approached from the relationship between the electron scattering intensity distribution and the chiral indices (u, v). We show that electron diffraction patterns can provide an accurate and unambiguous assignment of the chiral indices of carbon nanotubes. The chiral indices (u, v) can be read indiscriminately with a high accuracy from the intensity distribution on the principal layer lines in an electron diffraction pattern. The symmetry properties of electron diffraction from carbon nanotubes and the electron diffraction from deformed carbon nanotubes are also discussed in detail. It is shown that 2mm symmetry is always preserved for single-walled carbon nanotubes, but it can break down for multiwalled carbon nanotubes under some special circumstances

A small-displacement sensor using total internal reflection theory and surface plasmon resonance technology for heterodyne interferometry.

Science.gov (United States)

Wang, Shinn-Fwu

2009-01-01

A small-displacement sensor based on total-internal reflection theory and surface plasmon resonance technology is proposed for use in heterodyne interferometry. A small displacement can be obtained simply by measuring the variation in phase difference between s- and p-polarization states with the small-displacement sensor. The theoretical displacement resolution of the small-displacement sensor can reach 0.45 nm. The sensor has some additional advantages, e.g., a simple optical setup, high resolution, high sensitivity and rapid measurement. Its feasibility is also demonstrated.

Public Diplomacy and Refugee Relations Reflections of Turkey’s Refugees Relations on the International Media

Directory of Open Access Journals (Sweden)

Ergün Köksoy

2015-11-01

Full Text Available Public diplomacy is described as a new form of relations and communications between countries and societies in the field of international relations with the process of globalisation. The subject of refugees shown among the priority issues can be solved through international cooperation and solidarity with its results affecting all countries and societies, that’s why becoming part of public diplomacy. Asylum seekers and refugee rights are guaranteed by the Universal Declaration of Human Rights and considered to be an area that the international community needs to take the roles and share responsibilities. In this aspect, it is shown as global responsibilities and part of the humanitarian sensibility of countries and societies. In one hand, asylum seekers and refugees are considered to be the subject of the problem and crisis, on the other hand, due to contributing to the human and cultural interaction between the different communities, these are specified as part of public diplomacy. This article discusses the relationship between public diplomacy and refugees relations which provides the interaction between countries and effects the prestige and perception of them. In the study, to reveal the reflections of Turkey’s Refugees Relations on the International Media, three highest-circulation newspapers (“The Guardian”, “Le Monde”, “Der Spiegel” will be choosen from three important EU countries (United Kingdom, France, Germany. These newspapers’ headlines and news content which related to Turkey and Syrian refugees are going to be analized on three-month period. As a result, Turkish public diplomacy and refugee relations and its implications on the international media in the context of Syrian refugees will be evaluated and some recommendations for the future of Turkish public diplomacy and refugee relations will be provided.

Diffractive scattering

CERN Document Server

De Wolf, E.A.

2002-01-01

We discuss basic concepts and properties of diffractive phenomena in soft hadron collisions and in deep-inelastic scattering at low Bjorken-x. The paper is not a review of the rapidly developing field but presents an attempt to show in simple terms the close inter-relationship between the dynamics of high-energy hadronic and deep-inelastic diffraction. Using the saturation model of Golec-Biernat and Wusthoff as an example, a simple explanation of geometrical scaling is presented. The relation between the QCD anomalous multiplicity dimension and the Pomeron intercept is discussed.

Diffractive Scattering

International Nuclear Information System (INIS)

Wolf, E.A. de

2002-01-01

We discuss basic concepts and properties of diffractive phenomena in soft hadron collisions and in deep-inelastic scattering at low Bjorken - x. The paper is not a review of the rapidly developing field but presents an attempt to show in simple terms the close inter-relationship between the dynamics of high-energy hadronic and deep-inelastic diffraction. Using the saturation model of Golec-Biernat and Wuesthoff as an example, a simple explanation of geometrical scaling is presented. The relation between the QCD anomalous multiplicity dimension and the Pomeron intercept is discussed. (author)

Residual stress measurement of the jacket material for ITER coil by neutron diffraction

Energy Technology Data Exchange (ETDEWEB)

Tsuchiya, Yoshinori [Japan Atomic Energy Research Inst., Tokai, Ibaraki (Japan). Tokai Research Establishment

1998-03-01

Nickel-Iron based super alloy INCOLOY 908 is used for the jacket of a central solenoid coil (CS coil) of the International Thermonuclear Experimental Reactor (ITER). INCOLOY 908, however, has a possibility of fracture due to Stress Accelerated Grain Boundary Oxidation (SAGBO) under a tensile residual stress beyond 200MPa. Therefore it is necessary to measure the residual stress of the jacket to avoid SAGBO. We performed residual stress measurement of the jacket by neutron diffraction using the neutron diffractometer for residual stress analysis (RESA) installed at JRR-3M in JAERI. A sample depth dependence of internal strain was obtained from the (111) plane spacing. A residual stress distribution was calculated from the strain using Young`s modulus and Poisson`s ratio that were evaluated by a tensile test with neutron diffraction. The result shows that the tensile residual stress exceeds 200MPa of the SAGBO condition in some regions inside the jacket. (author)

Simultaneous detection of surface coverage and structure of krypton films on gold by helium atom diffraction and quartz crystal microbalance techniques.

Science.gov (United States)

Danışman, M Fatih; Özkan, Berrin

2011-11-01

We describe a quartz crystal microbalance setup that can be operated at low temperatures in ultra high vacuum with gold electrode surfaces acting as substrate surface for helium diffraction measurements. By simultaneous measurement of helium specular reflection intensity from the electrode surface and resonance frequency shift of the crystal during film adsorption, helium diffraction data can be correlated to film thickness. In addition, effects of interfacial viscosity on the helium diffraction pattern could be observed. To this end, first, flat gold films on AT cut quartz crystals were prepared which yield high enough helium specular reflection intensity. Then the crystals were mounted in the helium diffractometer sample holder and driven by means of a frequency modulation driving setup. Different crystal geometries were tested to obtain the best quality factor and preliminary measurements were performed on Kr films on gold surfaces. While the crystal structure and coverage of krypton films as a function of substrate temperature could successfully be determined, no depinning effects could be observed. © 2011 American Institute of Physics

A diamond-anvil high-pressure cell for X-ray diffraction on a single crystal

International Nuclear Information System (INIS)

Malinowski, M.

1987-01-01

A new diamond-anvil high-pressure cell is described which can be used in single-crystal X-ray diffraction instruments to collect X-ray intensity data from single-crystal samples up to hydrostatic pressures of about 10 GPa. A unique design allows two types of diffraction geometry to be applied in single-crystal high-pressure diffraction experiments. More than 85% of the Ewald sphere is accessible, and a continuous range of 2θ values is available from 0 up to about 160 0 . Pressure may be calibrated by the ruby fluorescence technique or by the use of an internal X-ray-standard single crystal. The design of our diamond-anvil cell would allow, with little or no modification, operation at high and low temperatures, optical studies and powder diffractometer work. (orig.)

Crystallization and preliminary X-ray diffraction analysis of red clover necrotic mosaic virus

International Nuclear Information System (INIS)

Martin, Stanton L.; Guenther, Richard H.; Sit, Tim L.; Swartz, Paul D.; Meilleur, Flora; Lommel, Steven A.; Rose, Robert B.

2010-01-01

Virions of red clover necrotic mosaic virus have been purified and crystallized. The space group was determined to be I23, with unit-cell parameter a = 377.8 Å. The crystals diffracted to 4 Å resolution. Red clover necrotic mosaic virus (RCNMV) is a species that belongs to the Tombusviridae family of plant viruses with a T = 3 icosahedral capsid. RCNMV virions were purified and were crystallized for X-ray analysis using the hanging-drop vapor-diffusion method. Self-rotation functions and systematic absences identified the space group as I23, with two virions in the unit cell. The crystals diffracted to better than 4 Å resolution but were very radiation-sensitive, causing rapid decay of the high-resolution reflections. The data were processed to 6 Å in the analysis presented here

Diffraction. Powder, amorphous, liquid

International Nuclear Information System (INIS)

Sosnowska, I.M.

1999-01-01

Neutron powder diffraction is a unique tool to observe all possible diffraction effects appearing in crystal. High-resolution neutron diffractometers have to be used in this study. Analysis of the magnetic structure of polycrystalline materials requires the use of high-resolution neutron diffraction in the range of large interplanar distances. As distinguished from the double axis diffractometers (DAS), which show high resolution only at small interplanar distances, TOF (time-of-flight) diffractometry offers the best resolution at large interplanar distances. (K.A.)

Label free imaging of cell-substrate contacts by holographic total internal reflection microscopy.

Science.gov (United States)

Mandracchia, Biagio; Gennari, Oriella; Marchesano, Valentina; Paturzo, Melania; Ferraro, Pietro

2017-09-01

The study of cell adhesion contacts is pivotal to understand cell mechanics and interaction at substrates or chemical and physical stimuli. We designed and built a HoloTIR microscope for label-free quantitative phase imaging of total internal reflection. Here we show for the first time that HoloTIR is a good choice for label-free study of focal contacts and of cell/substrate interaction as its sensitivity is enhanced in comparison with standard TIR microscopy. Finally, the simplicity of implementation and relative low cost, due to the requirement of less optical components, make HoloTIR a reasonable alternative, or even an addition, to TIRF microscopy for mapping cell/substratum topography. As a proof of concept, we studied the formation of focal contacts of fibroblasts on three substrates with different levels of affinity for cell adhesion. © 2017 Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim.

Combining total internal reflection sum frequency spectroscopy spectral imaging and confocal fluorescence microscopy.

Science.gov (United States)

Allgeyer, Edward S; Sterling, Sarah M; Gunewardene, Mudalige S; Hess, Samuel T; Neivandt, David J; Mason, Michael D

2015-01-27

Understanding surface and interfacial lateral organization in material and biological systems is critical in nearly every field of science. The continued development of tools and techniques viable for elucidation of interfacial and surface information is therefore necessary to address new questions and further current investigations. Sum frequency spectroscopy (SFS) is a label-free, nonlinear optical technique with inherent surface specificity that can yield critical organizational information on interfacial species. Unfortunately, SFS provides no spatial information on a surface; small scale heterogeneities that may exist are averaged over the large areas typically probed. Over the past decade, this has begun to be addressed with the advent of SFS microscopy. Here we detail the construction and function of a total internal reflection (TIR) SFS spectral and confocal fluorescence imaging microscope directly amenable to surface investigations. This instrument combines, for the first time, sample scanning TIR-SFS imaging with confocal fluorescence microscopy.

Duality in diffraction dissociations

International Nuclear Information System (INIS)

Santoro, Alberto.

1977-01-01

Diffractive dissociations (aN→a*πN) are naturally explained and a model that accounts for the three-variable correlation (mass-transfer-Jackson angle correlation) is presented. This model takes into account the three possible exchanges: t (pion), u(a*) and s(a) channel exchanger. The physical consequences of the model are: a strong mass-slope correlation due to the zeros of the amplitude, a factorization of diffractive dissociations (factorization of the Pomeron), the possibility of extending this model to double diffractive dissociation and diffraction by nuclei. This model was applied to the NN→NπN reaction. Using the usual parameters of the Deck model, a comparison is made with experiments for all available distributions. the strong slope of the peak at 1400 MeV is naturally explained [fr

A neutron diffraction study of ancient Greek ceramics

International Nuclear Information System (INIS)

Siouris, I.M.; Walter, J.

2006-01-01

Non-destructive neutron diffraction studies were performed on three 2nd-century BC archaeological pottery fragments from the excavation site of Neos Scopos, Serres, in North Greece. In all the 273 K diagrams quartz and feldspars phase fractions are dominant. Diopside and iron oxide phases were also identifiable. The diopside content is found to decrease with increasing quartz-feldspar compositions. Iron oxides containing minerals were found to be present and the phase compositions reflect upon the coloring of the samples. However, the different content compositions of the phases may suggest different regions of the original clay materials as well as different preparation techniques. The firing temperatures were determined to be in the range of 900-1000 deg. C

In situ x-ray reflectivity and grazing incidence x-ray diffraction study of L 1{sub 0} ordering in {sup 57}Fe/Pt multilayers

Energy Technology Data Exchange (ETDEWEB)

Raghavendra Reddy, V; Gupta, Ajay; Gome, Anil [UGC-DAE Consortium for Scientific Research, University Campus, Khandwa Road, Indore-452 017 (India); Leitenberger, Wolfram [Institute of Physics, University of Potsdam, 14469 Potsdam (Germany); Pietsch, U [Physics Department, University of Siegen, D-57068 Siegen (Germany)], E-mail: vrreddy@csr.ernet.in, E-mail: varimalla@yahoo.com

2009-05-06

In situ high temperature x-ray reflectivity and grazing incidence x-ray diffraction measurements in the energy dispersive mode are used to study the ordered face-centered tetragonal (fct) L 1{sub 0} phase formation in [Fe(19 A)/Pt(25 A)]{sub x 10} multilayers prepared by ion beam sputtering. With the in situ x-ray measurements it is observed that (i) the multilayer structure first transforms to a disordered FePt and subsequently to an ordered fct L 1{sub 0} phase, (ii) the ordered fct L 1{sub 0} FePt peaks start to appear at 320 deg. C annealing, (iii) the activation energy of the interdiffusion is 0.8 eV and (iv) ordered fct FePt grains have preferential out-of-plane texture. The magneto-optical Kerr effect and conversion electron Moessbauer spectroscopies are used to study the magnetic properties of the as-deposited and 400 deg. C annealed multilayers. The magnetic data for the 400 {sup 0}C annealed sample indicate that the magnetization is at an angle of {approx}50 deg. from the plane of the film.

Time of flight diffraction technique and applications for retaining rings and turbine discs

International Nuclear Information System (INIS)

Ashwin, P.

1990-01-01

During recent times the term Time of Flight has become a popular phrase in ultrasonic terminology. It is true to say that since ultrasonic energy was first applied for NDE applications, we have used the time of flight to measure the material thickness and establish the presence of discontinuities in metals and other materials. However, as digital ultrasonic systems have evolved we have added new terminology to the field of nondestructive testing, such that phrases as Time of Flight are often misunderstood or over used. Conventional ultrasonic practice (meaning code based ultrasonic inspection) is in most reliant on the measurement of the reflected amplitude response to establish the presence and size of material discontinuities, where the time of flight is the measurement of the ultrasound as it travels to and from the reflector. This industry standard technique has on many occasions been questioned in terms of its value, especially during defect sizing applications. To address the known limitations of amplitude based sizing criteria, a new technique was developed referred to as Time Of Flight Diffraction -TOFD. Instead of using the amount of ultrasonic energy reflected by a discontinuity, TOFD relies on an aspect of ultrasonics that until more recently has been ignored or overlooked. This is the phenomena of diffracted ultrasonic energy, Using diffracted energy it is possible to more accurately measure the size of a defect. More recently the technique has been used for the detection of defects, where due to the imaging capabilities of the instrumentation used, TOFD has illustrated the presence of defects which could not be identified by other ultrasonic methods

High-resolution X-ray diffraction with no sample preparation.

Science.gov (United States)

Hansford, G M; Turner, S M R; Degryse, P; Shortland, A J

2017-07-01

It is shown that energy-dispersive X-ray diffraction (EDXRD) implemented in a back-reflection geometry is extremely insensitive to sample morphology and positioning even in a high-resolution configuration. This technique allows high-quality X-ray diffraction analysis of samples that have not been prepared and is therefore completely non-destructive. The experimental technique was implemented on beamline B18 at the Diamond Light Source synchrotron in Oxfordshire, UK. The majority of the experiments in this study were performed with pre-characterized geological materials in order to elucidate the characteristics of this novel technique and to develop the analysis methods. Results are presented that demonstrate phase identification, the derivation of precise unit-cell parameters and extraction of microstructural information on unprepared rock samples and other sample types. A particular highlight was the identification of a specific polytype of a muscovite in an unprepared mica schist sample, avoiding the time-consuming and difficult preparation steps normally required to make this type of identification. The technique was also demonstrated in application to a small number of fossil and archaeological samples. Back-reflection EDXRD implemented in a high-resolution configuration shows great potential in the crystallographic analysis of cultural heritage artefacts for the purposes of scientific research such as provenancing, as well as contributing to the formulation of conservation strategies. Possibilities for moving the technique from the synchrotron into museums are discussed. The avoidance of the need to extract samples from high-value and rare objects is a highly significant advantage, applicable also in other potential research areas such as palaeontology, and the study of meteorites and planetary materials brought to Earth by sample-return missions.

The experience of being a member of the Student International Community of Practice: a collaborative reflection

Directory of Open Access Journals (Sweden)

Brighide M. Lynch

2015-05-01

Full Text Available Background: In 2010 a community of practice was set up for and by doctoral students engaged in person-centred and practitioner research. After three years, this community became part of a larger international community of practice. Aims and objectives: Captured under the stanzas of a poem and supported by the literature, this paper uses member narratives and creative expressions in a critical reflection on the experience of being a member of the Student International Community of Practice. Conclusions: Membership in the community of practice was experienced as beneficial, providing both support and challenge to enrich the doctoral students’ development as person-centred researchers. Retaining connectivity across an international landscape and finding effective ways to integrate new members into the community presented the greatest challenges. Implications for practice development: • The theoretical foundation and experiential knowledge could assist others considering support structures for the development of person-centred practices • Shared learning and co-creation of knowledge add value to the experience of being a doctoral researcher • Membership fluctuations present challenges to continuity of learning and the maintenance of a safe space with communities of practice. Such fluctuations, however, create chances for community members to experience diverse roles within the group and encourage explicit attention to person-centredness

Correct interpretation of diffraction properties of quartz crystals for X-ray optics applications

Energy Technology Data Exchange (ETDEWEB)

Huang, Xian-Rong; Gog, Thomas; Kim, Jungho; Kasman, Elina; Said, Ayman H.; Casa, Diego M.; Wieczorek, Michael; Hönnicke, Marcelo G.; Assoufid, Lahsen

2018-02-01

Quartz has hundreds of strong Bragg reflections that may offer a great number of choices for making fixed-angle X-ray analyzers and polarizers at virtually any hard X-ray energies with selectable resolution. However, quartz crystals, unlike silicon and germanium, are chiral and may thus appear in two different forms of handedness that are mirror images. Furthermore, because of the threefold rotational symmetry along thecaxis, the {h₁h₂h₃L} and {h₂h₁h₃L} Bragg reflections may have quite different Darwin bandwidth, reflectivity and angular acceptance, although they have the same Bragg angle. The design of X-ray optics from quartz crystals therefore requires unambiguous determination of the orientation, handedness and polarity of the crystals. The Laue method and single-axis diffraction technique can provide such information, but the variety of conventions used in the literature to describe quartz structures has caused widespread confusion. The current studies give detailed guidelines for design and fabrication of quartz X-ray optics, with special emphasis on the correct interpretation of Laue patterns in terms of the crystallography and diffraction properties of quartz. Meanwhile, the quartz crystals examined were confirmed by X-ray topography to have acceptably low densities of dislocations and other defects, which is the foundation for developing high-resolution quartz-based X-ray optics.

In situ observation of low temperature growth of Ge on Si(1 1 1) by reflection high energy electron diffraction

International Nuclear Information System (INIS)

Grimm, Andreas; Fissel, Andreas; Bugiel, Eberhard; Wietler, Tobias F.

2016-01-01

Highlights: • Investigation of the initial stages of epitaxial growth of Ge on Si(1 1 1) in situ by RHEED. • Impact of growth temperature on strain evolution for temperatures between 200 °C and 400 °C. • Epitaxy with a high degree of structural perfection already at growth temperature of 200 °C. • Ordered interfacial dislocation networks already at 200 °C. • Tensile strain contribution of Si(1 1 1) 7 × 7-surface reconstruction to strain relaxation process for epitaxial growth of Ge. - Abstract: In this paper we investigate the initial stages of epitaxial growth of Ge on Si(1 1 1) and the impact of growth temperature on strain evolution in situ by reflection high energy electron diffraction (RHEED) for temperatures between 200 °C and 400 °C. The change in surface morphology from a flat wetting layer to subsequent islanding that is characteristic for Stranski–Krastanov growth is monitored by spot intensity analysis. The corresponding critical layer thickness is determined to 3.1 < d c < 3.4 ML. In situ monitoring of the strain relaxation process reveals a contribution of the Si(1 1 1) 7 × 7-surface reconstruction to the strain relaxation process. High resolution transmission electron microscopy confirms that the Ge islands exhibit a high degree of structural perfection and an ordered interfacial misfit dislocation network already at a growth temperature of 200 °C is established. The temperature dependency of island shape, density and height is characterized by atomic force microscopy and compared to the RHEED investigations.

Reflection: A Socratic approach.

Science.gov (United States)

Van Seggelen-Damen, Inge C M; Van Hezewijk, René; Helsdingen, Anne S; Wopereis, Iwan G J H

2017-12-01

Reflection is a fuzzy concept. In this article we reveal the paradoxes involved in studying the nature of reflection. Whereas some scholars emphasize its discursive nature, we go further and underline its resemblance to the self-biased dialogue Socrates had with the slave in Plato's Meno . The individual and internal nature of the reflection process creates difficulty for studying it validly and reliably. We focus on methodological issues and use Hans Linschoten's view of coupled systems to identify, analyze, and interpret empirical research on reflection. We argue that researchers and research participants can take on roles in several possible system couplings. Depending on who controls the manipulation of the stimulus, who controls the measuring instrument, who interprets the measurement and the response, different types of research questions can be answered. We conclude that reflection may be validly studied by combining different couplings of experimenter, manipulation, stimulus, participant, measurement, and response.

A method of combining STEM image with parallel beam diffraction and electron-optical conditions for diffractive imaging

International Nuclear Information System (INIS)

He Haifeng; Nelson, Chris

2007-01-01

We describe a method of combining STEM imaging functionalities with nanoarea parallel beam electron diffraction on a modern TEM. This facilitates the search for individual particles whose diffraction patterns are needed for diffractive imaging or structural studies of nanoparticles. This also lays out a base for 3D diffraction data collection

Inelastic nucleon diffraction at high energy

International Nuclear Information System (INIS)

Goggi, G.

1975-01-01

Experiments carried out at ISR and at FNAL which have yielded a substantial amount of data on double diffraction processes, which were unambiguously indentified and measured and which provide new tools to study the dynamical properties shared by different classes of diffractive reactions are identified. In this review interest is focused on the experimental aspects of inclusive and exclusive results both on single and double diffraction and on the problems arising from their comparison. Problems covered include; inclusive and semi-inclusive diffraction, multiparticle inclusive studies, single-particle inclusive studies, resonance region, high mass region, exclusive single diffractive reactions, mass spectra, cross sections, t-dependence, decay angular properties, and double diffraction. (U.K.)

Aplanatic grazing incidence diffraction grating: a new optical element

International Nuclear Information System (INIS)

Hettrick, M.C.

1986-01-01

We present the theory of a grazing incidence reflection grating capable of imaging at submicron resolution. The optic is mechanically ruled on a spherical or cylindrical surface with varied groove spacings, delivering diffraction-limited response and a wide field of view at a selected wavelength. Geometrical aberrations are calculated on the basis of Fermat's principle, revealing significant improvements over a grazing incidence mirror. Aplanatic and quasi-aplanatic versions of the grating have applications in both imaging and scanning microscopes, microprobes, collimators, and telescopes. A 2-D crossed system of such gratings, similar to the grazing incidence mirror geometry of Kirkpatrick and Baez, could potentially provide spatial resolutions of --200 A

Structure determination of modulated structures by powder X-ray diffraction and electron diffraction

Czech Academy of Sciences Publication Activity Database

Zhou, Z.Y.; Palatinus, Lukáš; Sun, J.L.

2016-01-01

Roč. 3, č. 11 (2016), s. 1351-1362 ISSN 2052-1553 Institutional support: RVO:68378271 Keywords : electron diffraction * incommensurate structure * powder diffraction Subject RIV: BM - Solid Matter Physics ; Magnetism Impact factor: 4.036, year: 2016

Analysis of neutron diffraction spectra acquired in situ during stress-induced transformations in superelastic NiTi

International Nuclear Information System (INIS)

Vaidyanathan, R.; Bourke, M.A.; Dunand, D.C.

1999-01-01

Neutron diffraction spectra were obtained during various stages of a reversible stress-induced austenite to martensite phase transformation in superelastic NiTi. This was accomplished by neutron diffraction measurements on bulk polycrystalline NiTi samples simultaneously subjected to mechanical loading. Analysis of the data was carried out using individual lattice plane (hkl) reflections as well as by Rietveld refinement. In the Rietveld procedure, strains in austenite were described in terms of an isotropic (hkl independent) and an anisotropic (hkl dependent) component. At higher stresses, austenite lattice plane reflections exhibited nonlinear and dissimilar elastic responses which may be attributed to the transformation. The texture evolution is significant in both austenite and martensite phases during the transformation and two approaches were used to describe this evolving texture, i.e., an ellipsoidal model due to March - Dollase and a generalized spherical-harmonic approach. The respective predictions of the phase fraction evolution as a function of applied stress were compared. A methodology is thus established to quantify the discrete phase strains, phase volume fractions, and texture during such transformations. copyright 1999 American Institute of Physics

High Resolution Powder Diffraction and Structure Determination

International Nuclear Information System (INIS)

Cox, D. E.

1999-01-01

are familiar to laboratory diffractionists. This is reflected in the fact that there are already dedicated instruments for powder diffraction at a number of synchrotrons sources, including the NSLS, the Synchrotrons Radiation Source, Daresbury, the Photon Factory, Tsukuba and HASYLAB. In addition, most general purpose beamlines can be adapted for powder diffraction experiments fairly easily. Dedicated beamlines are also planned or under consideration at the next generation of synchrotrons sources, the European Synchrotron Radiation Facility, Grenoble, the Advanced Photon Source, Argonne, and the SPring-8 machine at Harima. These will be high brilliance sources with a much harder radiation spectrum that will offer many new possibilities for powder diffraction experiments, especially at energies above 10 keV

Study of optical Laue diffraction

International Nuclear Information System (INIS)

Chakravarthy, Giridhar; Allam, Srinivasa Rao; Satyanarayana, S. V. M.; Sharan, Alok

2014-01-01

We present the study of the optical diffraction pattern of one and two-dimensional gratings with defects, designed using desktop pc and printed on OHP sheet using laser printer. Gratings so prepared, using novel low cost technique provides good visual aid in teaching. Diffraction pattern of the monochromatic light (632.8nm) from the grating so designed is similar to that of x-ray diffraction pattern of crystal lattice with point defects in one and two-dimensions. Here both optical and x-ray diffractions are Fraunhofer. The information about the crystalline lattice structure and the defect size can be known

Gluon radiation in diffractive electroproduction

International Nuclear Information System (INIS)

Buchmueller, W.; McDermott, M.F.; Hebecker, A.

1996-07-01

Order α s -correlations to the diffractive structure functions F L D and F 2 D at large Q 2 and small x are evaluated in the semiclassical approach, where the initial proton is treated as a classical colour field. The diffractive final state contains a fast gluon in addition to a quark-antiquark pair. Two of these partons may have large transverse momentum. Our calculations lead to an intuitive picture of deep-inelastic diffractive processes which is very similar to Bjorken's aligned-jet model. Both diffractive structure functions contain leading twist contributions from high-p perpendicular to jets. (orig.)

Study of optical Laue diffraction

Energy Technology Data Exchange (ETDEWEB)

Chakravarthy, Giridhar, E-mail: cgiridhar84@gmail.com, E-mail: aloksharan@email.com; Allam, Srinivasa Rao, E-mail: cgiridhar84@gmail.com, E-mail: aloksharan@email.com; Satyanarayana, S. V. M., E-mail: cgiridhar84@gmail.com, E-mail: aloksharan@email.com; Sharan, Alok, E-mail: cgiridhar84@gmail.com, E-mail: aloksharan@email.com [Department of Physics, Pondicherry University, Puducherry-605014 (India)

2014-10-15

We present the study of the optical diffraction pattern of one and two-dimensional gratings with defects, designed using desktop pc and printed on OHP sheet using laser printer. Gratings so prepared, using novel low cost technique provides good visual aid in teaching. Diffraction pattern of the monochromatic light (632.8nm) from the grating so designed is similar to that of x-ray diffraction pattern of crystal lattice with point defects in one and two-dimensions. Here both optical and x-ray diffractions are Fraunhofer. The information about the crystalline lattice structure and the defect size can be known.

Design of structurally colored surfaces based on scalar diffraction theory

DEFF Research Database (Denmark)

Johansen, Villads Egede; Andkjær, Jacob Anders; Sigmund, Ole

2014-01-01

In this paper we investigate the possibility of controlling the color and appearance of surfaces simply by modifying the height profile of the surface on a nanoscale level. The applications for such methods are numerous: new design possibilities for high-end products, color engraving on any highly...... reflective surface, paint-free text and coloration, UV-resistant coloring, etc. In this initial study, the main focus is on finding a systematic way to obtain these results. For now the simulation and optimization is based on a simple scalar diffraction theory model. From the results, several design issues...

Imaging Early Steps of Sindbis Virus Infection by Total Internal Reflection Fluorescence Microscopy

Directory of Open Access Journals (Sweden)

Youling Gu

2011-01-01

Full Text Available Sindbis virus (SINV is an alphavirus that has a broad host range and has been widely used as a vector for recombinant gene transduction, DNA-based vaccine production, and oncolytic cancer therapy. The mechanism of SINV entry into host cells has yet to be fully understood. In this paper, we used single virus tracking under total internal reflection fluorescence microscopy (TIRFM to investigate SINV attachment to cell surface. Biotinylated viral particles were labeled with quantum dots, which retained viral viability and infectivity. By time-lapse imaging, we showed that the SINV exhibited a heterogeneous dynamics on the surface of the host cells. Analysis of SINV motility demonstrated a two-step attachment reaction. Moreover, dual color TIRFM of GFP-Rab5 and SINV suggested that the virus was targeted to the early endosomes after endocytosis. These findings demonstrate the utility of quantum dot labeling in studying the early steps and behavior of SINV infection.

Watch your step! A frustrated total internal reflection approach to forensic footwear imaging.

Science.gov (United States)

Needham, J A; Sharp, J S

2016-02-16

Forensic image retrieval and processing are vital tools in the fight against crime e.g. during fingerprint capture. However, despite recent advances in machine vision technology and image processing techniques (and contrary to the claims of popular fiction) forensic image retrieval is still widely being performed using outdated practices involving inkpads and paper. Ongoing changes in government policy, increasing crime rates and the reduction of forensic service budgets increasingly require that evidence be gathered and processed more rapidly and efficiently. A consequence of this is that new, low-cost imaging technologies are required to simultaneously increase the quality and throughput of the processing of evidence. This is particularly true in the burgeoning field of forensic footwear analysis, where images of shoe prints are being used to link individuals to crime scenes. Here we describe one such approach based upon frustrated total internal reflection imaging that can be used to acquire images of regions where shoes contact rigid surfaces.

Watch your step! A frustrated total internal reflection approach to forensic footwear imaging

Science.gov (United States)

Needham, J. A.; Sharp, J. S.

2016-02-01

Forensic image retrieval and processing are vital tools in the fight against crime e.g. during fingerprint capture. However, despite recent advances in machine vision technology and image processing techniques (and contrary to the claims of popular fiction) forensic image retrieval is still widely being performed using outdated practices involving inkpads and paper. Ongoing changes in government policy, increasing crime rates and the reduction of forensic service budgets increasingly require that evidence be gathered and processed more rapidly and efficiently. A consequence of this is that new, low-cost imaging technologies are required to simultaneously increase the quality and throughput of the processing of evidence. This is particularly true in the burgeoning field of forensic footwear analysis, where images of shoe prints are being used to link individuals to crime scenes. Here we describe one such approach based upon frustrated total internal reflection imaging that can be used to acquire images of regions where shoes contact rigid surfaces.

Diffraction dissociation: thirty five years after

International Nuclear Information System (INIS)

Zotov, N.P.; Tsarev, V.A.

1988-01-01

Review of the basic results and stages of studying one of the most interesting phenomena in high energy physics-diffraction dissociation (DD) of hadrons is presented. The review contains complete information concerning the basic experimental results and the most ''set'' DD theoretical models. Though the discussion focuses primarily on considering a single nucleon DD, this still allows one to fully describe the basic features of the phenomenon under investigation. The last part of the review is devoted to the most notable results obtained during DD experimental investigation in the last five years, which have not been reflected in the earlier published reviews. Signs of excited system parton structure and pomeron are clearly found in the new experimental data. It is underlined that DD mechanism understanding is closely connected with the solution of the confinement problem in the strong interaction theory and requires further experimental and theoretical investigations

Selecting a summation base in diffraction transformation of seismic recordings (in an example of Northern Sakhalin)

Energy Technology Data Exchange (ETDEWEB)

Bulatov, M.G.; Telegin, A.N.

1984-01-01

The effect of the dimensions of a processing base on the results of diffraction transformation of seismic recordings is examined. A formula is cited for rating the optimal summation base on the basis of a proposed range of slant angles of the reflecting boundaries. The recommendations for selecting a processing base are confirmed by factual material.

Diffraction attraction

International Nuclear Information System (INIS)

Anon.

1986-01-01

Elastic scattering – when colliding particles 'bounce' off each other like billiard balls – has always had a special interest for high energy physicists. While its simplicity makes for deep analogies with classical ideas like diffraction, its jbtle details also test our understanding of the intricate inner mechanisms which drive particle interactions. With a new stock of elastic scattering data now available thanks to experiments at the CERN proton-antiproton Collider, and with studies at higher energies imminent or planned, some seventy physicists gathered in the magnificent chateau at Blois, France, for a 'Workshop on Elastic and Diffractive Scattering at the Collider and Beyond'

Diffraction attraction

Energy Technology Data Exchange (ETDEWEB)

Anon.

1986-03-15

Elastic scattering – when colliding particles 'bounce' off each other like billiard balls – has always had a special interest for high energy physicists. While its simplicity makes for deep analogies with classical ideas like diffraction, its jbtle details also test our understanding of the intricate inner mechanisms which drive particle interactions. With a new stock of elastic scattering data now available thanks to experiments at the CERN proton-antiproton Collider, and with studies at higher energies imminent or planned, some seventy physicists gathered in the magnificent chateau at Blois, France, for a 'Workshop on Elastic and Diffractive Scattering at the Collider and Beyond'.

Observables of QCD diffraction

Science.gov (United States)

Mieskolainen, Mikael; Orava, Risto

2017-03-01

A new combinatorial vector space measurement model is introduced for soft QCD diffraction. The model independent mathematical construction resolves experimental complications; the theoretical framework of the approach includes the Good-Walker view of diffraction, Regge phenomenology together with AGK cutting rules and random fluctuations.

Historical review of neutron spectrometry and diffraction in Brazil - 50 years

International Nuclear Information System (INIS)

Voi, Dante L.; Ferreira, Francisco J.O.; Stasiulevicius, Roberto; Rodrigues, Claudio; Parente, Carlos B.R.; Mazzocchi, Vera L.; Mestnik Filho, Jose; Pugliesi, Reinaldo

2011-01-01

Neutron Spectrometry and Diffraction techniques began to be studied in Brazil with the construction of the first research reactors in the years 50 and 60, and were developed with the participation of national and international scientists. In particular, we note the perseverance of the Brazilian pioneer of nuclear energy, Dr. Marcello Damy de Souza Santos, and from that time, with the involvement of some of the early pioneers, such as the physicist Roberto Stasiulevicius, who had the privilege of working in all three Brazilian nuclear research reactors. All these scientists shared half a century of acquired knowledge, helping in the training of a number of experts who are now working in national and international nuclear institutes. The present work reviews in chronological order, the testimony of the historical facts associated with the development and application of experimental techniques using neutrons as a tool for materials analysis and studies for many areas of the sciences and also with the training of personnel. IPEN, IEN and CDTN, all institutes of the CNEN-Brazil, are important in the national and international scene as a result of the research carried out there and the large number of publications produced in the field of neutron spectrometry and diffraction from experimental work carried out using the IEA (5MW), Argonauta (5kW) and more recently, the IPR (250kW) research reactors. An extensive bibliography is also presented and this can be disseminated to everyone interested. (author)

The analysis of powder diffraction data

International Nuclear Information System (INIS)

David, W.I.F.; Harrison, W.T.A.

1986-01-01

The paper reviews neutron powder diffraction data analysis, with emphasis on the structural aspects of powder diffraction and the future possibilities afforded by the latest generation of very high resolution neutron and x-ray powder diffractometers. Traditional x-ray powder diffraction techniques are outlined. Structural studies by powder diffraction are discussed with respect to the Rietveld method, and a case study in the Rietveld refinement method and developments of the Rietveld method are described. Finally studies using high resolution powder diffraction at the Spallation Neutron Source, ISIS at the Rutherford Appleton Laboratory are summarized. (U.K.)

Diffraction by m-bonacci gratings

International Nuclear Information System (INIS)

Monsoriu, Juan A; Giménez, Marcos H; Furlan, Walter D; Barreiro, Juan C; Saavedra, Genaro

2015-01-01

We present a simple diffraction experiment with m-bonacci gratings as a new interesting generalization of the Fibonacci ones. Diffraction by these non-conventional structures is proposed as a motivational strategy to introduce students to basic research activities. The Fraunhofer diffraction patterns are obtained with the standard equipment present in most undergraduate physics labs and are compared with those obtained with regular periodic gratings. We show that m-bonacci gratings produce discrete Fraunhofer patterns characterized by a set of diffraction peaks which positions are related to the concept of a generalized golden mean. A very good agreement is obtained between experimental and numerical results and the students’ feedback is discussed. (paper)

Measuring the x-ray resolving power of bent potassium acid phthalate diffraction crystals

International Nuclear Information System (INIS)

Haugh, M. J.; Jacoby, K. D.; Wu, M.; Loisel, G. P.

2014-01-01

This report presents the results from measuring the X-ray resolving power of a curved potassium acid phthalate (KAP(001)) spectrometer crystal using two independent methods. It is part of a continuing effort to measure the fundamental diffraction properties of bent crystals that are used to study various characteristics of high temperature plasmas. Bent crystals like KAP(001) do not usually have the same diffraction properties as corresponding flat crystals. Models that do exist to calculate the effect of bending the crystal on the diffraction properties have simplifying assumptions and their accuracy limits have not been adequately determined. The type of crystals that we measured is being used in a spectrometer on the Z machine at Sandia National Laboratories in Albuquerque, New Mexico. The first technique for measuring the crystal resolving power measures the X-ray spectral line width of the characteristic lines from several metal anodes. The second method uses a diode X-ray source and a double crystal diffractometer arrangement to measure the reflectivity curve of the KAP(001) crystal. The width of that curve is inversely proportional to the crystal resolving power. The measurement results are analyzed and discussed

Measuring the x-ray resolving power of bent potassium acid phthalate diffraction crystals

Energy Technology Data Exchange (ETDEWEB)

Haugh, M. J., E-mail: haughmj@nv.doe.gov; Jacoby, K. D. [National Security Technologies, LLC, Livermore, California 94550 (United States); Wu, M.; Loisel, G. P. [Sandia National Laboratories, Albuquerque, New Mexico 87123 (United States)

2014-11-15

This report presents the results from measuring the X-ray resolving power of a curved potassium acid phthalate (KAP(001)) spectrometer crystal using two independent methods. It is part of a continuing effort to measure the fundamental diffraction properties of bent crystals that are used to study various characteristics of high temperature plasmas. Bent crystals like KAP(001) do not usually have the same diffraction properties as corresponding flat crystals. Models that do exist to calculate the effect of bending the crystal on the diffraction properties have simplifying assumptions and their accuracy limits have not been adequately determined. The type of crystals that we measured is being used in a spectrometer on the Z machine at Sandia National Laboratories in Albuquerque, New Mexico. The first technique for measuring the crystal resolving power measures the X-ray spectral line width of the characteristic lines from several metal anodes. The second method uses a diode X-ray source and a double crystal diffractometer arrangement to measure the reflectivity curve of the KAP(001) crystal. The width of that curve is inversely proportional to the crystal resolving power. The measurement results are analyzed and discussed.

High frequency time modulation of neutrons by LiNbO3 crystals with surface acoustic waves excited under the diffraction condition

International Nuclear Information System (INIS)

Takahashi, Toshio; Granzer, E.; Kikuta, Seishi; Tomimitsu, Hiroshi; Doi, Kenji.

1985-01-01

High frequency time modulation of neutrons was investigated by using Y-cut LiNbO 3 crystals with surface acoustic waves excited. A double crystal arrangement of (+, -) parallel setting was used for 030 symmetric Bragg-case reflections. Synchronized standing waves with a resonance frequency of 14.26 MHz were excited on the both crystals. Variation of the diffracted intensity with phase difference between two standing waves was studied. The result showed an intensity change of diffracted neutrons with twice the resonance frequency. (author)

Refinement of the ferri and paramagnetic phases of magnetite measured by neutron multiple diffraction

International Nuclear Information System (INIS)

Mazzochi, V.L.; Parente, C.B.R.

1989-10-01

Structural parameters of the ferri and paramagnetic phases of magnetite have been refined from neutron multiple diffraction data. Experimental patterns were obtained by measuring the III primary reflection of a natural single crystal of this compound, at room temperature for the ferrimagnetic phase and 703 0 C for the paramagnetic phase. Theoretical multiple diffraction patterns for both phases have been calculated by the program MULTI which uses the iterative method. In this method intensities are caluclated as Taylor series expansions summed up to a order sufficient for a good approximation. A step by step process has been used in the refinements similarly to the parameter-shift method. Final values for the discrepancy factor found for the ferri and paramagnetic phases were R = 3.96% and R = 3.46%, respectively. (author) [pt

Comparative study of macrotexture analysis using X-ray diffraction and electron backscattered diffraction techniques

International Nuclear Information System (INIS)

Serna, Marilene Morelli

2002-01-01

The macrotexture is one of the main characteristics in metallic materials, which the physical properties depend on the crystallographic direction. The analysis of the macrotexture to middles of the decade of 80 was just accomplished by the techniques of Xray diffraction and neutrons diffraction. The possibility of the analysis of the macrotexture using, the technique of electron backscattering diffraction in the scanning electronic microscope, that allowed to correlate the measure of the orientation with its location in the micro structure, was a very welcome tool in the area of engineering of materials. In this work it was studied the theoretical aspects of the two techniques and it was used of both techniques for the analysis of the macrotexture of aluminum sheets 1050 and 3003 with intensity, measured through the texture index 'J', from 2.00 to 5.00. The results obtained by the two techniques were shown reasonably similar, being considered that the statistics of the data obtained by the technique of electron backscatter diffraction is much inferior to the obtained by the X-ray diffraction. (author)

Experimental and theoretical investigations of diffraction enhanced imaging

International Nuclear Information System (INIS)

Wang Junyue; Zhu Peiping; Yuan Qingxi; Huang Wanxia; Shu Hang; Chen Bo; Li Enrong; Liu Yijin; Hu Tiandou; Wu Ziyu

2007-01-01

This contribution investigates the effect on the imaging contrast of the small angle scattering and of the rocking curve in the entire angular range. We show that based on the small angle scattering properties, the reflectivity of the crystal analyzer and the rocking curve of the monochromator-analyzer, in a diffraction enhanced imaging (DEI) experimental setup the contrast of the image collected at the top of the rocking curve is always higher than that of the apparent absorption image. Moreover, our experimental data confirm that the quality of a refraction image is superior to a refraction-like image. In order to understand the observed behavior we introduce and discuss the contribution of a new term in the classical DEI equation

Experimental and theoretical investigations of diffraction enhanced imaging

Energy Technology Data Exchange (ETDEWEB)

Wang Junyue [Beijing Synchrotron Radiation Facility, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049 (China); Graduate University of the Chinese Academy of Sciences, Beijing 100049 (China); Zhu Peiping [Beijing Synchrotron Radiation Facility, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049 (China)], E-mail: zhupp@ihep.ac.cn; Yuan Qingxi; Huang Wanxia [Beijing Synchrotron Radiation Facility, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049 (China); Shu Hang [Beijing Synchrotron Radiation Facility, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049 (China); Graduate University of the Chinese Academy of Sciences, Beijing 100049 (China); Chen Bo [Beijing Synchrotron Radiation Facility, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049 (China); Li Enrong [Beijing Synchrotron Radiation Facility, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049 (China); Graduate University of the Chinese Academy of Sciences, Beijing 100049 (China); Liu Yijin; Hu Tiandou; Wu Ziyu [Beijing Synchrotron Radiation Facility, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049 (China)

2007-09-21

This contribution investigates the effect on the imaging contrast of the small angle scattering and of the rocking curve in the entire angular range. We show that based on the small angle scattering properties, the reflectivity of the crystal analyzer and the rocking curve of the monochromator-analyzer, in a diffraction enhanced imaging (DEI) experimental setup the contrast of the image collected at the top of the rocking curve is always higher than that of the apparent absorption image. Moreover, our experimental data confirm that the quality of a refraction image is superior to a refraction-like image. In order to understand the observed behavior we introduce and discuss the contribution of a new term in the classical DEI equation.

Elements of seismic imaging and velocity analysis – Forward modeling and diffraction analysis of conventional seismic data from the North Sea

DEFF Research Database (Denmark)

Montazeri, Mahboubeh

2018-01-01

comprises important oil and gas reservoirs. By application of well-established conventional velocity analysis methods and high-quality diffraction imaging techniques, this study aims to increase the resolution and the image quality of the seismic data. In order to analyze seismic wave propagation......-outs and salt delineations, which can be extracted from the diffractions. The potential of diffraction imaging techniques was studied for 2D seismic stacked data from the North Sea. In this approach, the applied plane-wave destruction method was successful in order to suppress the reflections from the stacked....... This improved seismic imaging is demonstrated for a salt structure as well as for Overpressured Shale structures and the Top Chalk of the North Sea....

Takagi-Taupin description of x-ray dynamical diffraction from diffractive optics with large numerical aperture

International Nuclear Information System (INIS)

Yan Hanfei; Maser, Joerg; Macrander, Albert; Shen Qun; Vogt, Stefan; Stephenson, G. Brian; Kang, Hyon Chol

2007-01-01

We present a formalism of x-ray dynamical diffraction from volume diffractive optics with large numerical aperture and high aspect ratio, in an analogy to the Takagi-Taupin equations [Acta Crystallogr. 15, 1311 (1962); Bull. Soc. Fr. Mineral. Crystallogr. 87, 469 (1964)] for strained single crystals. We derive a set of basic equations for dynamical diffraction from volume diffractive optics, which enable us to study the focusing property of these optics with various grating profiles. We study volume diffractive optics that satisfy the Bragg condition to various degrees, namely, flat, tilted, and wedged geometries, and derive the curved geometries required for ultimate focusing. We show that the curved geometries satisfy both the Bragg condition everywhere and phase requirement for point focusing and effectively focus hard x rays to a scale close to the wavelength. Our calculations were made for an x-ray wavelength of 0.064 nm (19.5 keV)

X-ray Laue diffraction with allowance for second derivatives of amplitudes in dynamical diffraction equations

International Nuclear Information System (INIS)

Balyan, M.K.

2014-01-01

Asymmetrical Laue diffraction in a perfect crystal with a plane entrance surface is considered. The second derivatives of amplitudes in the direction, perpendicular to diffraction plane in the dynamical diffraction equations are taken into account. Using the corresponding Green function a general form for the amplitude of diffracted wave in the crystal is derived. The sizes of the source in both directions as well as the source of crystal distance and non-monochromaticity of the radiation incident on the crystal are taken into account. On the basis of obtained expression the coherent properties of the field depending on the sizes of the source and on the width of the spectrum of the incident radiation are analyzed. Taking into account the second derivatives of amplitudes with respect to the direction, perpendicular to the diffraction plane, the time dependent propagation equations for an X-ray pulse in a perfect crystal are given

Quantitative analysis of calcined fertilizers by X-ray diffraction patterns

International Nuclear Information System (INIS)

Cekinski, E.

1987-01-01

An X-ray diffraction pattern method for quantitative analyses of phosphate fertilizers obtained by calcination of a misture of Anitapolis phosphate concentrate and sodium carbonate is described. The method consists in plotting a calibration curve, using spinel (MgAl 2 O 4 ) as internal standard, of the phases that were formed by calcination, sintetized in laboratory. The tests conducted in order to avail the method accuracy showed good correlation between the obtained data and the real values. (author) [pt

Sutherland models for complex reflection groups

International Nuclear Information System (INIS)

Crampe, N.; Young, C.A.S.

2008-01-01

There are known to be integrable Sutherland models associated to every real root system, or, which is almost equivalent, to every real reflection group. Real reflection groups are special cases of complex reflection groups. In this paper we associate certain integrable Sutherland models to the classical family of complex reflection groups. Internal degrees of freedom are introduced, defining dynamical spin chains, and the freezing limit taken to obtain static chains of Haldane-Shastry type. By considering the relation of these models to the usual BC N case, we are led to systems with both real and complex reflection groups as symmetries. We demonstrate their integrability by means of new Dunkl operators, associated to wreath products of dihedral groups

CMS results on hard diffraction

CERN Document Server

INSPIRE-00107098

2013-01-01

In these proceedings we present CMS results on hard diffraction. Diffractive dijet production in pp collisions at $\\sqrt{s}$=7 TeV is discussed. The cross section for dijet production is presented as a function of $\\tilde{\\xi}$, representing the fractional momentum loss of the scattered proton in single-diffractive events. The observation of W and Z boson production in events with a large pseudo-rapidity gap is also presented.

X-ray diffraction study of KTP (KTiOPO4) crystals under a static electric field

International Nuclear Information System (INIS)

Sebastian, M.T.; Klapper, H.; Bolt, R.J.

1992-01-01

X-ray diffraction studies are made on ion-conducting potassium titanyl phosphate (KTP) crystals with in situ DC electric field along different crystallographic directions. The X-ray rocking curves recorded with an electric field along the polar b axis (which is the direction of ion conduction) show a strong enhancement of the 040 reflection intensity (reflecting planes normal to the b axis) whereas the h0l reflections (reflecting planes parallel to the polar axis) do not show any intensity change. For an electric field normal to the polar axis no intensity change, either in 040 or in h0l reflections occurs. This observation is supplemented by X-ray topography. The 040 X-ray topographs recorded with in situ electric field along b exhibit strong extinction contrast in the form of striations parallel to the polar (ion-conduction) axis. The 040 intensity increase and the striation contrast are attributed to lattice deformation by the space-charge polarization due to the movement of the K + ions under the influence of the electric field. (orig.)

Holographic Optical Elements Recorded in Silver Halide Sensitized Gelatin Emulsions. Part 2. Reflection Holographic Optical Elements

Science.gov (United States)

Kim, Jong Man; Choi, Byung So; Choi, Yoon Sun; Kim, Jong Min; Bjelkhagen, Hans I.; Phillips, Nicholas J.

2002-03-01

Silver halide sensitized gelatin (SHSG) holograms are similar to holograms recorded in dichromated gelatin (DCG), the main recording material for holographic optical elements (HOEs). The drawback of DCG is its low energetic sensitivity and limited spectral response. Silver halide materials can be processed in such a way that the final hologram will have properties like a DCG hologram. Recently this technique has become more interesting since the introduction of new ultra-fine-grain silver halide (AgHal) emulsions. In particular, high spatial-frequency fringes associated with HOEs of the reflection type are difficult to construct when SHSG processing methods are employed. Therefore an optimized processing technique for reflection HOEs recorded in the new AgHal materials is introduced. Diffraction efficiencies over 90% can be obtained repeatably for reflection diffraction gratings. Understanding the importance of a selective hardening process has made it possible to obtain results similar to conventional DCG processing. The main advantage of the SHSG process is that high-sensitivity recording can be performed with laser wavelengths anywhere within the visible spectrum. This simplifies the manufacturing of high-quality, large-format HOEs, also including high-quality display holograms of the reflection type in both monochrome and full color.

Neutron diffraction utilizing the T-O-F method

Energy Technology Data Exchange (ETDEWEB)

Niimura, N [Tohoku Univ., Sendai (Japan). Lab. of Nuclear Science

1974-12-01

Characteristic features of the TOF (time of flight) neutron diffraction are summarized. In this method, i) all the reciprocal points on the rod passing through the origin in the reciprocal space can be scanned by each burst of white neutrons, ii) it is easy to measure high index reflections at the large scattering angle, iii) each reflection is not affected by the higher-order harmonics, and iv) it is easy to measure the physical properties depending on the neutron wavelength. The pulse neutron generator as well as the data acquisition system in the Laboratory of Nuclear Science of Tohoku University is described. The TOF method seems to be very powerful if it is applied to accurate structure analysis. The data correction methods are discussed. The TOF method is prospective to the study of transient phenomena. In this method one can apply to the crystalline sample an external field pulsed with the same frequency as the neutrons. By using this method, the transient state of the polarization reversal of the ferroelectric NaNO/sub 2/ has been observed. The magnetically pulsed neutron TOF spectrometer is briefly introduced after a review of the chopper history.

Data processing software suite SITENNO for coherent X-ray diffraction imaging using the X-ray free-electron laser SACLA

International Nuclear Information System (INIS)

Sekiguchi, Yuki; Oroguchi, Tomotaka; Takayama, Yuki; Nakasako, Masayoshi

2014-01-01

The software suite SITENNO is developed for processing diffraction data collected in coherent X-ray diffraction imaging experiments of non-crystalline particles using an X-ray free-electron laser. Coherent X-ray diffraction imaging is a promising technique for visualizing the structures of non-crystalline particles with dimensions of micrometers to sub-micrometers. Recently, X-ray free-electron laser sources have enabled efficient experiments in the ‘diffraction before destruction’ scheme. Diffraction experiments have been conducted at SPring-8 Angstrom Compact free-electron LAser (SACLA) using the custom-made diffraction apparatus KOTOBUKI-1 and two multiport CCD detectors. In the experiments, ten thousands of single-shot diffraction patterns can be collected within several hours. Then, diffraction patterns with significant levels of intensity suitable for structural analysis must be found, direct-beam positions in diffraction patterns determined, diffraction patterns from the two CCD detectors merged, and phase-retrieval calculations for structural analyses performed. A software suite named SITENNO has been developed to semi-automatically apply the four-step processing to a huge number of diffraction data. Here, details of the algorithm used in the suite are described and the performance for approximately 9000 diffraction patterns collected from cuboid-shaped copper oxide particles reported. Using the SITENNO suite, it is possible to conduct experiments with data processing immediately after the data collection, and to characterize the size distribution and internal structures of the non-crystalline particles

Direct observation of strain in bulk subgrains and dislocation walls by high angular resolution three-dimensional X-ray diffraction

DEFF Research Database (Denmark)

Jakobsen, Bo; Lienert, U.; Almer, J.

2008-01-01

The X-ray diffraction (XRD) method "high angular resolution 3DXRD" is briefly introduced, and results are presented for a single bulk grain in a polycrystalline copper sample deformed in tension. It is found that the three-dimensional reciprocal-space intensity distribution of a 400 reflection...

Comparative studies of laser annealing technique and furnace annealing by X-ray diffraction and Raman analysis of lithium manganese oxide thin films for lithium-ion batteries

International Nuclear Information System (INIS)

Pröll, J.; Weidler, P.G.; Kohler, R.; Mangang, A.; Heißler, S.; Seifert, H.J.; Pfleging, W.

2013-01-01

The structure and phase formations of radio frequency magnetron sputtered lithium manganese oxide thin films (Li 1.1 Mn 1.9 O 4 ) under ambient air were studied. The influence of laser annealing and furnace annealing, respectively, on the bulk structure and surface phases was compared by using ex-situ X-ray diffraction and Raman analysis. Laser annealing technique formed a dominant (440)-reflection, furnace annealing led to both, (111)- and (440)-reflections within a cubic symmetry (S.G. Fd3m (227)). Additionally, in-situ Raman and in-situ X-ray diffraction were applied for online detection of phase transformation temperatures. In-situ X-ray diffraction measurements clearly identified the starting temperature for the (111)- and (440)-reflections around 525 °C and 400 °C, respectively. The 2θ Bragg peak positions of the characteristic (111)- and (440)-reflections were in good agreement with those obtained through conventional furnace annealing. Laser annealing of lithium manganese oxide films provided a quick and efficient technique and delivered a dominant (440)-reflection which showed the expected electrochemical behavior of the well-known two-step de-/intercalation process of lithium-ions into the cubic spinel structure within galvanostatic testing and cyclic voltammetry. - Highlights: ► Formation of cubic spinel-like phase of Li–Mn–O thin films by rapid laser annealing ► Laser annealing at 680 °C and 100 s was demonstrated as quick crystallization method. ► 400 °C was identified as characteristic onset temperature for (440)-reflex formation

Powder diffraction

Energy Technology Data Exchange (ETDEWEB)

Hart, M.

1995-12-31

the importance of x-ray powder diffraction as an analytical tool for phase identification of materials was first pointed out by Debye and Scherrer in Germany and, quite independently, by Hull in the US. Three distinct periods of evolution lead to ubiquitous application in many fields of science and technology. In the first period, until the mid-1940`s, applications were and developed covering broad categories of materials including inorganic materials, minerals, ceramics, metals, alloys, organic materials and polymers. During this formative period, the concept of quantitative phase analysis was demonstrated. In the second period there followed the blossoming of technology and commercial instruments became widely used. The history is well summarized by Parrish and by Langford and Loueer. By 1980 there were probably 10,000 powder diffractometers in routine use, making it the most widely used of all x-ray crystallographic instruments. In the third, present, period data bases became firmly established and sophisticated pattern fitting and recognition software made many aspects of powder diffraction analysis routine. High resolution, tunable powder diffractometers were developed at sources of synchrotron radiation. The tunability of the spectrum made it possible to exploit all the subtleties of x-ray spectroscopy in diffraction experiments.

Powder diffraction

International Nuclear Information System (INIS)

Hart, M.

1995-01-01

The importance of x-ray powder diffraction as an analytical tool for phase identification of materials was first pointed out by Debye and Scherrer in Germany and, quite independently, by Hull in the US. Three distinct periods of evolution lead to ubiquitous application in many fields of science and technology. In the first period, until the mid-1940's, applications were and developed covering broad categories of materials including inorganic materials, minerals, ceramics, metals, alloys, organic materials and polymers. During this formative period, the concept of quantitative phase analysis was demonstrated. In the second period there followed the blossoming of technology and commercial instruments became widely used. The history is well summarized by Parrish and by Langford and Loueer. By 1980 there were probably 10,000 powder diffractometers in routine use, making it the most widely used of all x-ray crystallographic instruments. In the third, present, period data bases became firmly established and sophisticated pattern fitting and recognition software made many aspects of powder diffraction analysis routine. High resolution, tunable powder diffractometers were developed at sources of synchrotron radiation. The tunability of the spectrum made it possible to exploit all the subtleties of x-ray spectroscopy in diffraction experiments

The primary extinction and static Debye-Waller factor in the characterization of textured nickel by X-ray diffraction

International Nuclear Information System (INIS)

Kryshtab, T.; Palacios G, J.; Cadena A, A.; Kryvko, A.

2015-01-01

The texture analysis using X-ray diffraction (XRD) implies measurement of pole figures (Pf) from the diffracted intensities considering the model of kinematical dispersion. The extinction phenomenon results in a decrease of diffracted intensity and that in turn in a decrease of pole densities (Pds). The phenomenon appears in the kinematical theory of XRD as the primary extinction and the secondary extinction to characterize the loss of intensity of kinematical dispersion. In turn, the static Debye-Waller factor is an integral characteristic of defects in crystals that is introduced in the kinematical theory of XRD and also is used in dynamical theory of XRD. In this work the correlation between the primary extinction coefficient and the static Debye-Waller factor in the case of textured nickel was determined. The value of static Debye-Waller factor was determined from the value of the calculated primary extinction coefficient. For the evaluation there were used Pds in the maxima of Pf obtained for 111 and 200 reflections with Mo Kα radiation, and the Pds in the maxima of Pf obtained for the first and second orders of these reflections with Cu Kα and Co Kα radiations. There were calculated the dislocation densities in grains using values of static Debye-Waller factor and the extinction coefficients. The dislocation densities calculated from these two characteristics are practically equal. (Author)

On a possible use of multiple Bragg reflections for high-resolution monochromatization of neutrons

Czech Academy of Sciences Publication Activity Database

Mikula, Pavol; Vrána, Miroslav; Wagner, V.

2004-01-01

Roč. 350, - (2004), e667-e670 ISSN 0921-4526 R&D Projects: GA ČR GA202/03/0891 Keywords : neutron diffraction * multiple reflections * higg-resolution monochromator Subject RIV: BM - Solid Matter Physics ; Magnetism Impact factor: 0.679, year: 2004

Splitting diffraction peak in different thickness LL-interferometer and determination of thickness of damaged layer induced by electron irradiation of plates

International Nuclear Information System (INIS)

Truni, K.G.; Sedrakyan, A.G.; Papoyan, A.A.; Bezirganyan, P.A.

1988-01-01

Amplitude of twice reflected beam is calculated analytically, oscillatory dependence of peak intensity in the centre of diffraction image on the small variations in thickness is shown. The expression, clearly binding the splitting value of diffraction peak with variation in thickness of the interferometer plates, is received. The effect of variation in thickness on the splitting value of focal line is studied experimentally in case of irradiation of the equal-arm Π-shaped interferometer blocks by fast electron flow, thickness of the originated damaged layers are determined

An active one-particle microrheometer: incorporating magnetic tweezers to total internal reflection microscopy.

Science.gov (United States)

Gong, Xiangjun; Hua, Li; Wu, Chi; Ngai, To

2013-03-01

We present a novel microrheometer by incorporating magnetic tweezers in the total internal reflection microscopy (TIRM) that enables measuring of viscoelastic properties of materials near solid surface. An evanescent wave generated by a solid∕liquid interface in the TIRM is used as the incident light source in the microrheometer. When a probe particle (of a few micrometers diameter) moves near the interface, it can interact with the evanescent field and reflect its position with respect to the interface by the scattered light intensity. The exponential distance dependence of the evanescent field, on the one hand, makes this technique extremely sensitive to small changes from z-fluctuations of the probe (with a resolution of several nanometers), and on the other, it does not require imaging of the probe with high lateral resolution. Another distinct advantage is the high sensitivity in determining the z position of the probe in the absence of any labeling. The incorporated magnetic tweezers enable us to effectively manipulate the distance of the embedded particle from the interface either by a constant or an oscillatory force. The force ramp is easy to implement through a coil current ramp. In this way, the local viscous and elastic properties of a given system under different confinements can therefore be measured by resolving the near-surface particle motion. To test the feasibility of applying this microrheology to soft materials, we measured the viscoelastic properties of sucrose and poly(ethylene glycol) solutions and compared the results to bulk rheometry. In addition, we applied this technique in monitoring the structure and properties of deformable microgel particles near the flat surface.

Quantitative measurement of phase variation amplitude of ultrasonic diffraction grating based on diffraction spectral analysis

Energy Technology Data Exchange (ETDEWEB)

Pan, Meiyan, E-mail: yphantomohive@gmail.com; Zeng, Yingzhi; Huang, Zuohua, E-mail: zuohuah@163.com [Laboratory of Quantum Engineering and Quantum Materials, School of Physics and Telecommunication Engineering, South China Normal University, Guangzhou, Guangdong 510006 (China)

2014-09-15

A new method based on diffraction spectral analysis is proposed for the quantitative measurement of the phase variation amplitude of an ultrasonic diffraction grating. For a traveling wave, the phase variation amplitude of the grating depends on the intensity of the zeroth- and first-order diffraction waves. By contrast, for a standing wave, this amplitude depends on the intensity of the zeroth-, first-, and second-order diffraction waves. The proposed method is verified experimentally. The measured phase variation amplitude ranges from 0 to 2π, with a relative error of approximately 5%. A nearly linear relation exists between the phase variation amplitude and driving voltage. Our proposed method can also be applied to ordinary sinusoidal phase grating.

Electric-field-induced internal deformation in piezoelectric BiB{sub 3}O{sub 6} crystals

Energy Technology Data Exchange (ETDEWEB)

Schmidt, O.; Gorfman, S.; Pietsch, U. [Solid State Physics Department, University of Siegen (Germany)

2008-11-15

For the first time electric-field-induced atomic displacements (internal strains) in non-ferroelectric polar BiB{sub 3}O{sub 6} single crystal plates (point symmetry 2) were investigated using X-ray diffraction technique. The intensity variations of selected Bragg reflections were collected for three different orientations of the applied external electric field vector with respect to the crystal lattice and used for calculating the microscopic structural response of BiB{sub 3}O{sub 6}. Due to the limited number of the reflections providing measurable changes in Bragg intensities we restricted ourselves in analyzing the shift of the B{sub 3}O{sub 6} sublattice relative to the Bi one. In addition, we considered the deformation of the Bi-O, B(1)-O and B(2)-O bond lengths and identified the [B(2)O{sub 3}] group as the most sensitive structural unit to an external electric perturbation. (copyright 2008 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim) (orig.)

Nonlinear reflection of shock shear waves in soft elastic media.

Science.gov (United States)

Pinton, Gianmarco; Coulouvrat, François; Gennisson, Jean-Luc; Tanter, Mickaël

2010-02-01

For fluids, the theoretical investigation of shock wave reflection has a good agreement with experiments when the incident shock Mach number is large. But when it is small, theory predicts that Mach reflections are physically unrealistic, which contradicts experimental evidence. This von Neumann paradox is investigated for shear shock waves in soft elastic solids with theory and simulations. The nonlinear elastic wave equation is approximated by a paraxial wave equation with a cubic nonlinear term. This equation is solved numerically with finite differences and the Godunov scheme. Three reflection regimes are observed. Theory is developed for shock propagation by applying the Rankine-Hugoniot relations and entropic constraints. A characteristic parameter relating diffraction and non-linearity is introduced and its theoretical values are shown to match numerical observations. The numerical solution is then applied to von Neumann reflection, where curved reflected and Mach shocks are observed. Finally, the case of weak von Neumann reflection, where there is no reflected shock, is examined. The smooth but non-monotonic transition between these three reflection regimes, from linear Snell-Descartes to perfect grazing case, provides a solution to the acoustical von Neumann paradox for the shear wave equation. This transition is similar to the quadratic non-linearity in fluids.

Stresses in plasma-sprayed Cr2O3 coatings measured by neutron diffraction

Czech Academy of Sciences Publication Activity Database

Dubský, Jiří; Prask, H. J.; Matějíček, Jiří; Gnäupel-Herold, T.

2002-01-01

Roč. 75, - (2002), s. 1-3 ISSN 0947-8396. [International Conference on Neutron Scattreing. Munich, 09.08.2001-13.08.2002] R&D Projects: GA ČR GA106/01/0094 Institutional research plan: CEZ:AV0Z2043910 Keywords : plasma sprayed, diffraction Subject RIV: JK - Corrosion ; Surface Treatment of Materials Impact factor: 2.231, year: 2002

Diffraction enhanced X-ray imaging of mammals crystalline lens

International Nuclear Information System (INIS)

Antunes, A.; Hoennicke, M.G.; Safatle, A.M.V.; Cusatis, C.; Moraes Barros, P.S.; Morelhao, S.L.

2005-01-01

Crystalline lenses are transparent biological materials where the organization of the lens fibers can also be affected by changes at molecular level, and therefore the structure and morphology of the tissue can be correlated to the loss of transparency of the lens. In this work, internal structure of mammal lenses regarding the long-range ordering of the fibers are investigated by diffraction enhanced X-ray imaging (DEI) radiography. Moreover, DEI and absorption X-ray synchrotron radiographs for healthy and cataractous crystalline lenses are compared. Significant differences in healthy and cataractous crystalline lenses are observed

Undergraduate experiment with fractal diffraction gratings

International Nuclear Information System (INIS)

Monsoriu, Juan A; Furlan, Walter D; Pons, Amparo; Barreiro, Juan C; Gimenez, Marcos H

2011-01-01

We present a simple diffraction experiment with fractal gratings based on the triadic Cantor set. Diffraction by fractals is proposed as a motivating strategy for students of optics in the potential applications of optical processing. Fraunhofer diffraction patterns are obtained using standard equipment present in most undergraduate physics laboratories and compared with those obtained with conventional periodic gratings. It is shown that fractal gratings produce self-similar diffraction patterns which can be evaluated analytically. Good agreement is obtained between experimental and numerical results.

Neutron diffraction studies of glasses

International Nuclear Information System (INIS)

Wright, A.C.

1987-01-01

A survey is given of the application of neutron diffraction to structural studies of oxide and halide glasses. As with crystalline materials, neutron and X-ray diffraction are the major structural probes for glasses and other amorphous solids, particularly in respect of intermediate range order. The glasses discussed mostly have structures which are dominated by a network in which the bonding is predominantly covalent. The examples discussed demonstrate the power of the neutron diffraction technique in the investigation of the structures of inorganic glasses. The best modern diffraction experiments are capable of providing accurate data with high real space resolution, which if used correctly, are an extremely fine filter for the various structural models proposed in the literature. 42 refs

Investigation of multiple Bragg reflections at a constant neutron wavelength and their possible separation

International Nuclear Information System (INIS)

Mikula, P; Vrána, M; Šaroun, J; Em, V; Seong, B S

2012-01-01

Multiple Bragg reflections (MBR) realized in one bent-perfect crystal (BPC) slab by sets of different lattice planes behave differently in comparison to the case of perfect nondeformed or mosaic crystal. Individual sets of lattice planes are mutually in dispersive diffraction geometry and the kinematical approach can be applied on this MBR process. It has been found that contrary to the perfect nondeformed or mosaic crystal, individual reflections participating in the MBR process can be spatially separated.

Reflections on 21 years

International Nuclear Information System (INIS)

Eklund, S.; Mandel, H.; Teller, E.

1977-01-01

Personal reflections after twenty one years of nuclear power are presented by a number of those who were international figures in the nuclear energy field during that period. Lessons learnt, achievements, prospects and predictions for the future are discussed in eleven brief surveys. (U.K.)

I19, the small-molecule single-crystal diffraction beamline at Diamond Light Source.

Science.gov (United States)

Nowell, Harriott; Barnett, Sarah A; Christensen, Kirsten E; Teat, Simon J; Allan, David R

2012-05-01

The dedicated small-molecule single-crystal X-ray diffraction beamline (I19) at Diamond Light Source has been operational and supporting users for over three years. I19 is a high-flux tunable-wavelength beamline and its key details are described in this article. Much of the work performed on the beamline involves structure determination from small and weakly diffracting crystals. Other experiments that have been supported to date include structural studies at high pressure, studies of metastable species, variable-temperature crystallography, studies involving gas exchange in porous materials and structural characterizations that require analysis of the diffuse scattering between Bragg reflections. A range of sample environments to facilitate crystallographic studies under non-ambient conditions are available as well as a number of options for automation. An indication of the scope of the science carried out on the beamline is provided by the range of highlights selected for this paper.

High-energy particle diffraction

International Nuclear Information System (INIS)

Barone, V.; Predazzi, E.

2002-01-01

This monograph gives a comprehensive and up-to-date overview of soft and hard diffraction processes in strong interaction physics. The first part covers the general formalism (the optical analogy, the eikonal picture, high-energy kinematics, S-matrix theory) and soft hadron-hadron scattering (including the Regge theory) in a complete and mature presentation. It can be used as a textbook in particle physics classes. The remainder of the book is devoted to the 'new diffraction': the pomeron in QCD, low-x physics, diffractive deep inelastic scattering and related processes, jet production etc. It presents recent results and experimental findings and their phenomenological interpretations. This part addresses graduate students as well as researchers. (orig.)

Application of extended-crystal diffraction techniques to the symmetry and structure analysis of 221-PbBiSrCaCuO

International Nuclear Information System (INIS)

Goodman, P.; Miller, P.

1993-01-01

The discovery of a series of layer-perovskite superconducting compounds by Maeda et al. (1988) presented a challenge for present day electron diffraction techniques, due to their common occurrence as mixed phases, and the existence of complex structural modulations of more than one type. Cowley's (1976) theory developed specifically for describing diffraction effects from layered crystals having a micro-domainal sub-structure seems particularly well suited to the task of solving these structures, while the technique of extended-crystal diffraction is shown here to be capable of providing data of sufficient precision for this analysis. The present study is made on the 221 compound of PbBiSrCaCuO. Using the above diffraction techniques it is shown that the true symmetry of the whole structure is orthorhombic, Amaa, and not monoclinic as previously assumed, and that the superlattice reflections arise as a result of a basic microdomainal constitution, rather than from a uniform and incommensurate modulation. 8 figs

Undergraduate Experiment with Fractal Diffraction Gratings

Science.gov (United States)

Monsoriu, Juan A.; Furlan, Walter D.; Pons, Amparo; Barreiro, Juan C.; Gimenez, Marcos H.

2011-01-01

We present a simple diffraction experiment with fractal gratings based on the triadic Cantor set. Diffraction by fractals is proposed as a motivating strategy for students of optics in the potential applications of optical processing. Fraunhofer diffraction patterns are obtained using standard equipment present in most undergraduate physics…

Proposed frustrated-total-reflection acoustic sensing method

International Nuclear Information System (INIS)

Hull, J.R.

1981-01-01

Modulation of electromagnetic energy transmission through a frustrated-total-reflection device by pressure-induced changes in the index of refraction is proposed for use as an acoustic detector. Maximum sensitivity occurs for angles of incidence near the critical angle. The minimum detectable pressure in air is limited by Brownian noise. Acoustic propagation losses and diffraction of the optical beam by the acoustic signal limit the minimum acoustic wavelength to lengths of the order of the spatial extent of the optical beam. The response time of the method is fast enough to follow individual acoustic waves

Calculated efficiencies of three-material low stress coatings for diffractive x-ray transmission optics

International Nuclear Information System (INIS)

Kubec, Adam; Braun, Stefan; Gawlitza, Peter; Menzel, Maik; Leson, Andreas

2016-01-01

Diffractive X-ray optical elements made by thin film coating techniques such as multilayer Laue lenses (MLL) and multilayer zone plates (MZP) are promising approaches to achieve resolutions in hard X-ray microscopy applications of less than 10 nm. The challenge is to make a lens with a large numerical aperture on the one hand and a decent working distance on the other hand. One of the limiting factors with the coated structures is the internal stress in the films, which can lead to significant bending of the substrate and various types of unwanted diffraction effects. Several approaches have been discussed to overcome this challenge. One of these is a three-material combination such as Mo/MoSi_2/Si, where four single layers per period are deposited. Mo and Si represent the absorber and spacer in this case while MoSi_2 forms a diffusion barrier; in addition the thicknesses of absorber and spacer are chosen to minimize residual stress of the overall coating. Here the diffraction efficiency as well as the profile of the beam in the focal plane are discussed in order to find a tradeoff between lowest residual stress and best diffraction properties.

Discussion on accuracy of weld residual stress measurement by neutron diffraction. Influence of strain free reference

International Nuclear Information System (INIS)

Suzuki, Hiroshi; Akita, Koichi

2012-01-01

It is required to evaluate a strain-free reference, α 0 , to perform accurate stress measurement using neutron diffraction. In this study, accuracy of neutron stress measurement was quantitatively discussed from α 0 evaluations on a dissimilar metal butt-weld between a type 304 austenitic stainless steel and an A533B low alloy ferritic steel. A strain-free standard specimen and a sliced specimen with 10 mm thickness taken from the dissimilar metal butt-weld were utilized. In the lattice constant evaluation using the standard specimen, average lattice constant derived from multiple hkl reflections was evaluated as the stress-free reference with cancelling out an intergranular strain. Comparing lattice constant distributions in each reflection with average lattice constant distribution in the standard specimen, αFe211 and γFe311 reflections were judged as a suitable reflection for neutron strain measurement to reduce intergranular strain effects. Residual stress distribution in the sliced specimen evaluated using α 0 measured here exhibited higher accuracy than that measured using strain gauges. On the other hand, α 0 distributions were evaluated using the sliced specimen under the plane-stress condition. Existence of slight longitudinal residual stresses near the weld center decreased accuracy of the α 0 evaluations, which means that it is required to optimize the thickness of the sliced specimen for accurate α 0 evaluation under plane strain condition. As a conclusion of this study, it was confirmed that procedures of accurate α 0 evaluation, optimization of the measurement condition, and multiple evaluations on the results play an important role to improve accuracy of the residual stress measurement using neutron diffraction. (author)

Trapezoidal diffraction grating beam splitters in single crystal diamond

Science.gov (United States)

Kiss, Marcell; Graziosi, Teodoro; Quack, Niels

2018-02-01

Single Crystal Diamond has been recognized as a prime material for optical components in high power applications due to low absorption and high thermal conductivity. However, diamond microstructuring remains challenging. Here, we report on the fabrication and characterization of optical diffraction gratings exhibiting a symmetric trapezoidal profile etched into a single crystal diamond substrate. The optimized grating geometry diffracts the transmitted optical power into precisely defined proportions, performing as an effective beam splitter. We fabricate our gratings in commercially available single crystal CVD diamond plates (2.6mm x 2.6mm x 0.3mm). Using a sputter deposited hard mask and patterning by contact lithography, the diamond is etched in an inductively coupled oxygen plasma with zero platen power. The etch process effectively reveals the characteristic {111} diamond crystal planes, creating a precisely defined angled (54.7°) profile. SEM and AFM measurements of the fabricated gratings evidence the trapezoidal shape with a pitch of 3.82μm, depth of 170 nm and duty cycle of 35.5%. Optical characterization is performed in transmission using a 650nm laser source perpendicular to the sample. The recorded transmitted optical power as function of detector rotation angle shows a distribution of 21.1% in the 0th order and 23.6% in each +/-1st order (16.1% reflected, 16.6% in higher orders). To our knowledge, this is the first demonstration of diffraction gratings with trapezoidal profile in single crystal diamond. The fabrication process will enable beam splitter gratings of custom defined optical power distribution profiles, while antireflection coatings can increase the efficiency.

Two-dimensional x-ray diffraction

CERN Document Server

He, Bob B

2009-01-01

Written by one of the pioneers of 2D X-Ray Diffraction, this useful guide covers the fundamentals, experimental methods and applications of two-dimensional x-ray diffraction, including geometry convention, x-ray source and optics, two-dimensional detectors, diffraction data interpretation, and configurations for various applications, such as phase identification, texture, stress, microstructure analysis, crystallinity, thin film analysis and combinatorial screening. Experimental examples in materials research, pharmaceuticals, and forensics are also given. This presents a key resource to resea

Diffraction dissociation at the LHC

Energy Technology Data Exchange (ETDEWEB)

Jenkovszky, Laszlo [Bogolyubov Institute for Theoretical Physics (BITP), Ukrainian National Academy of Sciences 14-b, Metrolohichna str., Kiev, 03680, Ukraine and Wigner Research Centre for Physics, Hungarian Academy of Sciences 1525 Budapest, POB 49 (Hungary); Orava, Risto [Institute of Physics, Division of Elementary Particle Physics, P.O. Box 64 (Gustaf Haellstroeminkatu 2a), FI-00014 University of Helsinki, Finland and CERN, CH-1211 Geneva 23 (Switzerland); Salii, Andrii [Bogolyubov Institute for Theoretical Physics (BITP), Ukrainian National Academy of Sciences 14-b, Metrolohichna str., Kiev, 03680 (Ukraine)

2013-04-15

We report on recent calculations of low missing mass single (SD) and double (DD) diffractive dissociation at LHC energies. The calculations are based on a dual-Regge model, dominated by a single Pomeron exchange. The diffractively excited states lie on the nucleon trajectory N*, appended by the isolated Roper resonance. Detailed predictions for the squared momentum transfer and missing mass dependence of the differential and integrated single-and double diffraction dissociation in the kinematical range of present and future LHC measurements are given.

Diffraction dissociation at the LHC

International Nuclear Information System (INIS)

Jenkovszky, László; Orava, Risto; Salii, Andrii

2013-01-01

We report on recent calculations of low missing mass single (SD) and double (DD) diffractive dissociation at LHC energies. The calculations are based on a dual-Regge model, dominated by a single Pomeron exchange. The diffractively excited states lie on the nucleon trajectory N*, appended by the isolated Roper resonance. Detailed predictions for the squared momentum transfer and missing mass dependence of the differential and integrated single-and double diffraction dissociation in the kinematical range of present and future LHC measurements are given.

X-Ray diffraction studies of silicon implanted with high energy ions

International Nuclear Information System (INIS)

Wieteska, K.; Wierzchowski, W.; Graeff, W.

1998-01-01

The character of lattice deformation in silicon implanted with high energy alpha-particles and protons was studied using a number of X-ray methods. The experiments included double-crystal spectrometer method as well as single crystal section and projection topography realised both with conventional and synchrotron X-ray sources. All observed diffraction patterns were reasonably explainable assuming the lattice parameter distribution proportional to the vacancy-interstitial distribution coming from the Biersack-ziegler theory. The theoretical rocking curves and distribution in back-reflection double-crystal and section topographs well corresponding to the experimental results were calculated using numerical integration of the takagi-taupin equations

Reflections on the development of international nuclear law

International Nuclear Information System (INIS)

Lamm, Vanda

2017-01-01

Over the course of more than seven decades, treaty norms on the production and utilisation of nuclear energy have been developed, which together form a special section within international law. These norms are the consequence of the unique nature of the field, namely that on the one hand some aspects of the uses of nuclear energy should be covered by totally new and special norms (e.g. in the field of disarmament, seeking to eliminate or at least to control the spread of nuclear weapons, and nuclear weapons tests) and on the other hand that several traditional legal solutions were not suitable for the problems that emerged in connection with other uses of nuclear energy (like liability). In this article, three aspects of the development of that special section of international law will be explored, namely: the close connections between the regulation of peaceful and military uses of nuclear energy; the effects of nuclear catastrophes on the development of international nuclear legislation; and the interaction between soft law norms and binding norms in the area of nuclear law

International health law : an emerging field of public international law

NARCIS (Netherlands)

Toebes, Brigit

This article discusses the nature and scope of international health law as an emerging field of public international law. It is argued that the protection of health reflects a pressing social need that should now be spoken of in the vocabulary of international law. Furthermore, there is an urgent

In-situ neutron diffraction characterization of temperature dependence deformation in α-uranium

Science.gov (United States)

Calhoun, C. A.; Garlea, E.; Sisneros, T. A.; Agnew, S. R.

2018-04-01

In-situ strain neutron diffraction measurements were conducted at temperature on specimens coming from a clock-rolled α-uranium plate, and Elasto-Plastic Self-Consistent (EPSC) modeling was employed to interpret the findings. The modeling revealed that the active slip systems exhibit a thermally activated response, while deformation twinning remains athermal over the temperature ranges explored (25-150 °C). The modeling also allowed assessment of the effects of thermal residual stresses on the mechanical response during compression. These results are consistent with those from a prior study of room-temperature deformation, indicating that the thermal residual stresses strongly influence the internal strain evolution of grain families, as monitored with neutron diffraction, even though accounting for these residual stresses has little effect on the macroscopic flow curve, except in the elasto-plastic transition.

Extending Whole Slide Imaging: Color Darkfield Internal Reflection Illumination (DIRI for Biological Applications.

Directory of Open Access Journals (Sweden)

Yoshihiro Kawano

Full Text Available Whole slide imaging (WSI is a useful tool for multi-modal imaging, and in our work, we have often combined WSI with darkfield microscopy. However, traditional darkfield microscopy cannot use a single condenser to support high- and low-numerical-aperture objectives, which limits the modality of WSI. To overcome this limitation, we previously developed a darkfield internal reflection illumination (DIRI microscope using white light-emitting diodes (LEDs. Although the developed DIRI is useful for biological applications, substantial problems remain to be resolved. In this study, we propose a novel illumination technique called color DIRI. The use of three-color LEDs dramatically improves the capability of the system, such that color DIRI (1 enables optimization of the illumination color; (2 can be combined with an oil objective lens; (3 can produce fluorescence excitation illumination; (4 can adjust the wavelength of light to avoid cell damage or reactions; and (5 can be used as a photostimulator. These results clearly illustrate that the proposed color DIRI can significantly extend WSI modalities for biological applications.

Dynamics from diffraction

International Nuclear Information System (INIS)

Goodwin, Andrew L.; Tucker, Matthew G.; Cope, Elizabeth R.; Dove, Martin T.; Keen, David A.

2006-01-01

We explore the possibility that detailed dynamical information might be extracted from powder diffraction data. Our focus is a recently reported technique that employs statistical analysis of atomistic configurations to calculate dynamical properties from neutron total scattering data. We show that it is possible to access the phonon dispersion of low-frequency modes using such an approach, without constraining the results in terms of some pre-defined dynamical model. The high-frequency regions of the phonon spectrum are found to be less well preserved in the diffraction data

Contribution to diffraction theory; Contribution a la theorie de la diffraction

Energy Technology Data Exchange (ETDEWEB)

Chako, N [Commissariat a l' Energie Atomique, Saclay (France). Centre d' Etudes Nucleaires

1966-11-01

In a first part, we have given a general and detailed treatment of the modern theory of diffraction. The rigorous theory is formulated as a boundary value problem of the wave equation or Maxwell equations. However, up to the present time, such a program of treating diffraction by optical systems, even for simple optical instruments, has not been realized due to the complicated character of the boundary conditions. The recent developments show clearly the nature of the approximation of the classical theories originally due to Fresnel and Young, later formulated in a rigorous manner by Kirchhoff and Rubinowicz, respectively and, at the same time the insufficiency of these theories in explaining a number of diffraction phenomena. Furthermore, we have made a study of the limitations of the approximate theories and the recent attempts to improve these. The second part is devoted to a general mathematical treatment of the theory of diffraction of optical systems including aberrations. After a general and specific analysis of geometrical and wave aberrations along classical and modern (Nijboer) lines, we have been able to evaluate the diffraction integrals representing the image field at any point in image space explicitly, when the aberrations are small. Our formulas are the generalisations of all anterior results obtained by previous investigators. Moreover, we have discussed the Zernike-Nijboer theory of aberration and generalised it not only for rotational systems, but also for non-symmetric systems as well, including the case of non circular apertures. The extension to non-circular apertures is done by introducing orthogonal functions or polynomials over such aperture shapes. So far the results are valid for small aberrations, that is to say, where the deformation of the real wave front emerging from the optical system is less than a wave length of light or of the electromagnetic wave from the ideal wave front. If the aberrations are large, then one must employ the

Contribution to diffraction theory; Contribution a la theorie de la diffraction

Energy Technology Data Exchange (ETDEWEB)

Chako, N. [Commissariat a l' Energie Atomique, Saclay (France). Centre d' Etudes Nucleaires

1966-11-01

In a first part, we have given a general and detailed treatment of the modern theory of diffraction. The rigorous theory is formulated as a boundary value problem of the wave equation or Maxwell equations. However, up to the present time, such a program of treating diffraction by optical systems, even for simple optical instruments, has not been realized due to the complicated character of the boundary conditions. The recent developments show clearly the nature of the approximation of the classical theories originally due to Fresnel and Young, later formulated in a rigorous manner by Kirchhoff and Rubinowicz, respectively and, at the same time the insufficiency of these theories in explaining a number of diffraction phenomena. Furthermore, we have made a study of the limitations of the approximate theories and the recent attempts to improve these. The second part is devoted to a general mathematical treatment of the theory of diffraction of optical systems including aberrations. After a general and specific analysis of geometrical and wave aberrations along classical and modern (Nijboer) lines, we have been able to evaluate the diffraction integrals representing the image field at any point in image space explicitly, when the aberrations are small. Our formulas are the generalisations of all anterior results obtained by previous investigators. Moreover, we have discussed the Zernike-Nijboer theory of aberration and generalised it not only for rotational systems, but also for non-symmetric systems as well, including the case of non circular apertures. The extension to non-circular apertures is done by introducing orthogonal functions or polynomials over such aperture shapes. So far the results are valid for small aberrations, that is to say, where the deformation of the real wave front emerging from the optical system is less than a wave length of light or of the electromagnetic wave from the ideal wave front. If the aberrations are large, then one must employ the

Multiple scattering in grazing-incidence X-ray diffraction: impact on lattice-constant determination in thin films

Energy Technology Data Exchange (ETDEWEB)

Resel, Roland, E-mail: roland.resel@tugraz.at; Bainschab, Markus; Pichler, Alexander [Graz University of Technology, Graz (Austria); Dingemans, Theo [Delft University of Technology, Delft (Netherlands); Simbrunner, Clemens [Johannes Kepler University, Linz (Austria); University of Bremen, Bremen (Germany); Stangl, Julian [Johannes Kepler University, Linz (Austria); Salzmann, Ingo [Humboldt University, Berlin (Germany)

2016-04-20

The use of grazing-incidence X-ray diffraction to determine the crystal structure from thin films requires accurate positions of Bragg peaks. Refraction effects and multiple scattering events have to be corrected or minimized. Dynamical scattering effects are observed in grazing-incidence X-ray diffraction experiments using an organic thin film of 2,2′:6′,2′′-ternaphthalene grown on oxidized silicon as substrate. Here, a splitting of all Bragg peaks in the out-of-plane direction (z-direction) has been observed, the magnitude of which depends both on the incidence angle of the primary beam and the out-of-plane angle of the scattered beam. The incident angle was varied between 0.09° and 0.25° for synchrotron radiation of 10.5 keV. This study reveals comparable intensities of the split peaks with a maximum for incidence angles close to the critical angle of total external reflection of the substrate. This observation is rationalized by two different scattering pathways resulting in diffraction peaks at different positions at the detector. In order to minimize the splitting, the data suggest either using incident angles well below the critical angle of total reflection or angles well above, which sufficiently attenuates the contributions from the second scattering path. This study highlights that the refraction of X-rays in (organic) thin films has to be corrected accordingly to allow for the determination of peak positions with sufficient accuracy. Based thereon, a reliable determination of the lattice constants becomes feasible, which is required for crystallographic structure solutions from thin films.

Neutron diffraction tomography: a unique, 3D inspection technique for crystals using an intensifier TV system

International Nuclear Information System (INIS)

Davidson, J.B.; Case, A.L.

1978-01-01

The application of phosphor-intensifier-TV techniques to neutron topography and tomography of crystals is described. The older, analogous x-ray topography using wavelengths approximately 1.5A is widely used for surface inspection. However, the crystal must actually be cut in order to see diffraction anomalies beneath the surface. Because 1.5-A thermal neutrons are highly penetrating, much larger and thicker specimens can be used. Also, since neutrons have magnetic moments, they are diffracted by magnetic structures within crystals. In neutron volume topography, the entire crystal or a large part of it is irradiated, and the images obtained are superimposed reflections from the total volume. In neutron tomography (or section topography), a collimated beam irradiates a slice (0.5 to 10 mm) of the crystal. The diffracted image is a tomogram from this part only. A series of tomograms covering the crystal can be taken as the specimen is translated in steps across the narrow beam. Grains, voids, twinning, and other defects from regions down to 1 mm in size can be observed and isolated. Although at present poorer in resolution than the original neutron and film methods, the TV techniques are much faster and, in some cases, permit real-time viewing. Two camera systems are described: a counting camera having a 150 mm 6 Li-ZnS screen for low-intensity reflections which are integrated in a digital memory, and a 300-mm system using analog image storage. Topographs and tomograms of several crystals ranging in size from 4 mm to 80 mm are shown

Reflective Self-Regenerative Systems Architecture Study

National Research Council Canada - National Science Library

Pu, Carlton; Blough, Douglas

2006-01-01

In this study, we develop the Reflective Self-Regenerative Systems (RSRS) architecture in detail, describing the internal structure of each component and the mutual invocations among the components...

In-situ neutron diffraction study on work-hardening behavior in a ferrite-martensite dual phase steel

OpenAIRE

Morooka, Satoshi; Sato, Naoko; Ojima, Mayumi; Harjo, Stefanus; Adachi, Yoshitaka; Tomota, Yo; Umezawa, Osamu

2011-01-01

Strength and work-hardening in steels have been discussed from the viewpoint of heterogeneous deformation. In-situ neutron diffraction techniques made clear that the misfit strains between grains accompanied with the grain-scaled internal stress (intergranular stress). In the dual phase steel, the intergranular stress was superposed on phase stress. Both long-range internal stress and short-range one like forest dislocation hardening may cause the resistance for dislocation motion in the steels.

Effect of environmental temperature on diffraction efficiency for multilayer diffractive optical elements in Mid-wave infrared

Science.gov (United States)

Piao, Mingxu; Cui, Qingfeng; Zhu, Hao; Zhang, Bo

2014-11-01

In this paper, the effect of environmental temperature change on multilayer diffractive optical elements (MLDOEs) is evaluated from the viewpoint of the diffraction efficiency and the polychromatic integral diffraction efficiency (PIDE). As environmental temperature changes, the microstructure heights of MLDOEs expand or contract, and refractive indices of substrate materials also change. Based on the changes in microstructure height and substrate material index with environmental temperature, the theoretical relation between diffraction efficiency of MLDOEs and environmental temperature is deduced. A practical 3-5μm Mid-wave infrared (MWIR) optical system designed with a MLDOE, which made of ZNSE and GE, is discussed to illustrate the influence of environmental temperature change. The result shows that diffraction efficiency reduction is no more than 85% and PIDE reduction is less than 50% when environmental temperature ranges from -20°C to 60°C. According to the calculated diffraction efficiency in different environmental temperatures, the MTF of hybrid optical system is modified and the modified MTF curve is compared with the original MTF curve. Although the hybrid optical system achieved passive athermalization in above environmental temperature range, the modified MTF curve also remarkably decline in environmental temperature extremes after the consideration of diffraction efficiency change of MLDOE. It is indicated that the image quality of hybrid optical system with ZNSE-GE MLDOE is significantly sensitive to environmental temperature change. The analysis result can be used for optical engineering design with MLDOEs in MWIR.

Synchrotron X-ray diffraction investigations on strains in the oxide layer of an irradiated Zircaloy fuel cladding

Energy Technology Data Exchange (ETDEWEB)

Chollet, Mélanie, E-mail: melanie.chollet@psi.ch [Paul Scherrer Institute, NES, 5232 Villigen (Switzerland); Valance, Stéphane; Abolhassani, Sousan; Stein, Gene [Paul Scherrer Institute, NES, 5232 Villigen (Switzerland); Grolimund, Daniel [Paul Scherrer Institute, SLS, 5232 Villigen (Switzerland); Martin, Matthias; Bertsch, Johannes [Paul Scherrer Institute, NES, 5232 Villigen (Switzerland)

2017-05-15

For the first time the microstructure of the oxide layer of a Zircaloy-2 cladding after 9 cycles of irradiation in a boiling water reactor has been analyzed with synchrotron micro-X-ray diffraction. Crystallographic strains of the monoclinic and to some extent of the tetragonal ZrO{sub 2} are depicted through the thick oxide layer. Thin layers of sub-oxide at the oxide-metal interface as found for autoclave-tested samples and described in the literature, have not been observed in this material maybe resulting from irradiation damage. Shifts of selected diffraction peaks of the monoclinic oxide show that the uniform strain produced during oxidation is orientated in the lattice and displays variations along the oxide layer. Diffraction peaks and their shifts from families of diffracting planes could be translated into a virtual tensor. This virtual tensor exhibits changes through the oxide layer passing by tensile or compressive components. - Highlights: •A Zircaloy-2 cladding irradiated 9 cycles was investigated thanks to synchrotron X-ray diffraction. •Microstructure and uniform strain through the oxide layer is revealed. •The m-ZrO{sub 2} uniform strain is oriented presenting compression along the (−111) plane. •Virtual tensor is built based on reflecting planes of families of grains. •Tensor components vary from tensile to compressive along the oxide layer.

Synchrotron X-ray diffraction investigations on strains in the oxide layer of an irradiated Zircaloy fuel cladding

International Nuclear Information System (INIS)

Chollet, Mélanie; Valance, Stéphane; Abolhassani, Sousan; Stein, Gene; Grolimund, Daniel; Martin, Matthias; Bertsch, Johannes

2017-01-01

For the first time the microstructure of the oxide layer of a Zircaloy-2 cladding after 9 cycles of irradiation in a boiling water reactor has been analyzed with synchrotron micro-X-ray diffraction. Crystallographic strains of the monoclinic and to some extent of the tetragonal ZrO 2 are depicted through the thick oxide layer. Thin layers of sub-oxide at the oxide-metal interface as found for autoclave-tested samples and described in the literature, have not been observed in this material maybe resulting from irradiation damage. Shifts of selected diffraction peaks of the monoclinic oxide show that the uniform strain produced during oxidation is orientated in the lattice and displays variations along the oxide layer. Diffraction peaks and their shifts from families of diffracting planes could be translated into a virtual tensor. This virtual tensor exhibits changes through the oxide layer passing by tensile or compressive components. - Highlights: •A Zircaloy-2 cladding irradiated 9 cycles was investigated thanks to synchrotron X-ray diffraction. •Microstructure and uniform strain through the oxide layer is revealed. •The m-ZrO 2 uniform strain is oriented presenting compression along the (−111) plane. •Virtual tensor is built based on reflecting planes of families of grains. •Tensor components vary from tensile to compressive along the oxide layer.

Effect of diffraction and film-thickness gradients on wafer-curvature measurements of thin-film stress

International Nuclear Information System (INIS)

Breiland, W.G.; Lee, S.R.; Koleske, D.D.

2004-01-01

When optical measurements of wafer curvature are used to determine thin-film stress, the laser beams that probe the sample are usually assumed to reflect specularly from the curved surface of the film and substrate. Yet, real films are not uniformly thick, and unintended thickness gradients produce optical diffraction effects that steer the laser away from the ideal specular condition. As a result, the deflection of the laser in wafer-curvature measurements is actually sensitive to both the film stress and the film-thickness gradient. We present a Fresnel-Kirchhoff optical diffraction model of wafer-curvature measurements that provides a unified description of these combined effects. The model accurately simulates real-time wafer-curvature measurements of nonuniform GaN films grown on sapphire substrates by vapor-phase epitaxy. During thin-film growth, thickness gradients cause the reflected beam to oscillate asymmetrically about the ideal position defined by the stress-induced wafer curvature. This oscillating deflection has the same periodicity as the reflectance of the growing film, and the deflection amplitude is a function of the film-thickness gradient, the mean film thickness, the wavelength distribution of the light source, the illuminated spot size, and the refractive indices of the film and substrate. For typical GaN films grown on sapphire, misinterpretation of these gradient-induced oscillations can cause stress-measurement errors that approach 10% of the stress-thickness product; much greater errors occur in highly nonuniform films. Only transparent films can exhibit substantial gradient-induced deflections; strongly absorbing films are immune

Hard scattering and a diffractive trigger

International Nuclear Information System (INIS)

Berger, E.L.; Collins, J.C.; Soper, D.E.; Sterman, G.

1986-02-01

Conclusions concerning the properties of hard scattering in diffractively produced systems are summarized. One motivation for studying diffractive hard scattering is to investigate the interface between Regge theory and perturbative QCD. Another is to see whether diffractive triggering can result in an improvement in the signal-to-background ratio of measurements of production of very heavy quarks. 5 refs

Intensity Distribution of the Three-Wave Diffraction from Dislocation Epitaxial Layers in the Reciprocal Space

Science.gov (United States)

Kyutt, R. N.

2018-04-01

The three-wave X-ray diffraction in strongly disordered epitaxial layers of GaN and ZnO is experimentally investigated. The charts of the intensity distribution in the reciprocal space are plotted in coordinates q θ and q ϕ for the most intensive three-wave combination (1010)/(1011) by means of subsequent θ- and ϕ-scanning. A nontrivial shape of the θ-sections of these contours at a distance from the ϕ center of reflection is revealed; it is different for different samples. For the θ-curves at the center of reflection, we observed a common peak that may be approximated by the Voigt function with a power-low decrease in the intensity at the wings; the decrease law (from-4.5 to-5.0) is found to be considerably greater than that for the similar curves of two-wave diffraction and not depending on the dislocation density and distribution in layers. In some films we observed a coarse-block structure; in addition, it follows from the distribution in the reciprocal space that these blocks are turned with respect to each other around a normal to the surface, which allows us to suggest the existence of low-angle boundaries between them, consisting exclusively of edge dislocations.

A QCD analysis of ZEUS diffractive data

Energy Technology Data Exchange (ETDEWEB)

Chekanov, S.; Derrick, M.; Magill, S. [Argonne National Laboratory, Argonne, IL (US)] (and others)

2009-11-15

ZEUS inclusive diffractive cross-section measurements have been used in a DGLAP next-to-leading-order QCD analysis to extract the diffractive parton distribution functions. Data on diffractive dijet production in deep inelastic scattering have also been included to constrain the gluon density. Predictions based on the extracted parton densities are compared to diffractive charm and dijet photoproduction data. (orig.)

A QCD analysis of ZEUS diffractive data

International Nuclear Information System (INIS)

Chekanov, S.; Derrick, M.; Magill, S.

2009-11-01

ZEUS inclusive diffractive cross-section measurements have been used in a DGLAP next-to-leading-order QCD analysis to extract the diffractive parton distribution functions. Data on diffractive dijet production in deep inelastic scattering have also been included to constrain the gluon density. Predictions based on the extracted parton densities are compared to diffractive charm and dijet photoproduction data. (orig.)

Silicon supported lipid-DNA thin film structures at varying temperature studied by energy dispersive X-ray diffraction and neutron reflectivity.

Science.gov (United States)

Domenici, F; Castellano, C; Dell'Unto, F; Albinati, A; Congiu, A

2011-11-01

Non-viral gene transfection by means of lipid-based nanosystems, such as solid supported lipid assemblies, is often limited due to their lack of stability and the consequent loss of efficiency. Therefore not only a detailed thermo-lyotropic study of these DNA-lipid complexes is necessary to understand their interaction mechanisms, but it can also be considered as a first step in conceiving and developing new transfection biosystems. The aim of our study is a structural characterization of 1,2-dioleoyl-sn-glycero-3-phosphatidylcholine (DOPC)-dimethyl-dioctadecyl-ammonium bromide (DDAB)-DNA complex at varying temperature using the energy dispersive X-ray diffraction (EDXD) and neutron reflectivity (NR) techniques. We have shown the formation of a novel thermo-lyotropic structure of DOPC/DDAB thin film self-organized in multi-lamellar planes on (100)-oriented silicon support by spin coating, thus enlightening its ability to include DNA strands. Our NR measurements indicate that the DOPC/DDAB/DNA complex forms temperature-dependent structures. At 65°C and relative humidity of 100% DNA fragments are buried between single lamellar leaflets constituting the hydrocarbon core of the lipid bilayers. This finding supports the consistency of the hydrophobic interaction model, which implies that the coupling between lipid tails and hypo-hydrated DNA single strands could be the driving force of DNA-lipid complexation. Upon cooling to 25°C, EDXD analysis points out that full-hydrated DOPC-DDAB-DNA can switch in a different metastable complex supposed to be driven by lipid heads-DNA electrostatic interaction. Thermotropic response analysis also clarifies that DOPC has a pivotal role in promoting the formation of our observed thermophylic silicon supported lipids-DNA assembly. Copyright © 2011 Elsevier B.V. All rights reserved.

Diffraction enhanced x-ray imaging

International Nuclear Information System (INIS)

Thomlinson, W.; Zhong, Z.; Johnston, R.E.; Sayers, D.

1997-09-01

Diffraction enhanced imaging (DEI) is a new x-ray radiographic imaging modality using synchrotron x-rays which produces images of thick absorbing objects that are almost completely free of scatter. They show dramatically improved contrast over standard imaging applied to the same phantoms. The contrast is based not only on attenuation but also the refraction and diffraction properties of the sample. The diffraction component and the apparent absorption component (absorption plus extinction contrast) can each be determined independently. This imaging method may improve the image quality for medical applications such as mammography

Influence of 4,4’-azobis (4-cyanopentanoic acid in Transmission and Reflection Gratings Stored in a PVA/AA Photopolymer

Directory of Open Access Journals (Sweden)

Elena Fernandez

2016-03-01

Full Text Available Holographic transmission gratings with a spatial frequency of 2658 lines/mm and reflection gratings with a spatial frequency of 4553 lines/mm were stored in a polyvinyl alcohol (PVA/acrylamide (AA based photopolymer. This material can reach diffraction efficiencies close to 100% for spatial frequencies about 1000 lines/mm. However, for higher spatial frequencies, the diffraction efficiency decreases considerably as the spatial frequency increases. To enhance the material response at high spatial frequencies, a chain transfer agent, the 4,4’-azobis (4-cyanopentanoic acid, ACPA, is added to the composition of the material. Different concentrations of ACPA are incorporated into the main composition of the photopolymer to find the concentration value that provides the highest diffraction efficiency. Moreover, the refractive index modulation and the optical thickness of the transmission and reflection gratings were obtained, evaluated and compared to procure more information about the influence of the ACPA on them.

Crystal structure of the martensite phase in the ferromagnetic shape memory compound Ni2MnGa studied by electron diffraction

International Nuclear Information System (INIS)

Fukuda, Takashi; Kushida, Hiroaki; Todai, Mitsuharu; Kakeshita, Tomoyuki; Mori, Hirotaro

2009-01-01

The electron diffraction patterns of Ni 2 MnGa show six satellites at ±q M , ±2q M and ±3q M , with q M = 0.427(5) g 22 -bar 0 between fundamental reflections in the martensite phase, and two satellites at ±q I , with q I = 0.340(5) g 22 -bar 0 in the intermediate phase, meaning that these phases have incommensurate structures. In addition, the diffraction pattern of the intermediate phase continuously changes to that of the parent phase via the X-phase, suggesting the existence of a multicritical phenomenon.

Uniting Electron Crystallography and Powder Diffraction

CERN Document Server

Shankland, Kenneth; Meshi, Louisa; Avilov, Anatoly; David, William

2012-01-01

The polycrystalline and nanocrystalline states play an increasingly important role in exploiting the properties of materials, encompassing applications as diverse as pharmaceuticals, catalysts, solar cells and energy storage. A knowledge of the three-dimensional atomic and molecular structure of materials is essential for understanding and controlling their properties, yet traditional single-crystal X-ray diffraction methods lose their power when only polycrystalline and nanocrystalline samples are available. It is here that powder diffraction and single-crystal electron diffraction techniques take over, substantially extending the range of applicability of the crystallographic principles of structure determination.  This volume, a collection of teaching contributions presented at the Crystallographic Course in Erice in 2011, clearly describes the fundamentals and the state-of-the-art of powder diffraction and electron diffraction methods in materials characterisation, encompassing a diverse range of discipl...

Reflections on Dead Theory in International Relations

Science.gov (United States)

Thakur, Vineet

2016-01-01

In this short autobiographical essay, I trace my journey in the discipline of International Relations. While entering the discipline, I, along with a host of my classmates, were enamoured by the exciting possibilities of thinking theoretically. Almost a decade later, those promises look bleak. From the perspective of a student in the discipline, I…

LACDIF, a new electron diffraction technique obtained with the LACBED configuration and a C{sub s} corrector: Comparison with electron precession

Energy Technology Data Exchange (ETDEWEB)

Morniroli, J.P. [Laboratoire de Metallurgie Physique et Genie des Materiaux, UMR CNRS 8517, USTL and ENSCL, Cite Scientifique, 59655 Villeneuve d' Ascq (France)], E-mail: jean-paul.morniroli@univ-lille1.fr; Houdellier, F.; Roucau, C. [CEMES-CNRS, 29 Rue Jeanne Marvig, BP 94347, 31055 Toulouse Cedex 4 (France); Puiggali, J.; Gesti, S. [Departament d' Enginyeria Quimica, Universitat Politecnica de Catalunya, Av. Diagonal 647, 08028 Barcelona (Spain); Redjaimia, A. [Laboratoire de Science et Genie des Surfaces, UMR CNRS 7570, Ecole des Mines de Nancy, Parc de Saurupt 54042 Nancy (France)

2008-01-15

By combining the large-angle convergent-beam electron diffraction (LACBED) configuration together with a microscope equipped with a C{sub s} corrector it is possible to obtain good quality spot patterns in image mode and not in diffraction mode as it is usually the case. These patterns have two main advantages with respect to the conventional selected-area electron diffraction (SAED) or microdiffraction patterns. They display a much larger number of reflections and the diffracted intensity is the integrated intensity. These patterns have strong similarities with the electron precession patterns and they can be used for various applications like the identification of the possible space groups of a crystal from observations of the Laue zones or the ab-initio structure identifications. Since this is a defocused method, another important application concerns the analysis of electron beam-sensitive materials. Successful applications to polymers are given in the present paper to prove the validity of this method with regards to these materials.

Diffraction contrast imaging using virtual apertures

International Nuclear Information System (INIS)

Gammer, Christoph; Burak Ozdol, V.; Liebscher, Christian H.; Minor, Andrew M.

2015-01-01

Two methods on how to obtain the full diffraction information from a sample region and the associated reconstruction of images or diffraction patterns using virtual apertures are demonstrated. In a STEM-based approach, diffraction patterns are recorded for each beam position using a small probe convergence angle. Similarly, a tilt series of TEM dark-field images is acquired. The resulting datasets allow the reconstruction of either electron diffraction patterns, or bright-, dark- or annular dark-field images using virtual apertures. The experimental procedures of both methods are presented in the paper and are applied to a precipitation strengthened and creep deformed ferritic alloy with a complex microstructure. The reconstructed virtual images are compared with conventional TEM images. The major advantage is that arbitrarily shaped virtual apertures generated with image processing software can be designed without facing any physical limitations. In addition, any virtual detector that is specifically designed according to the underlying crystal structure can be created to optimize image contrast. - Highlights: • A dataset containing all structural information of a given position is recorded. • The dataset allows reconstruction of virtual diffraction patterns or images. • Specific virtual apertures are designed to image precipitates in a complex alloy. • Virtual diffraction patterns from arbitrarily small regions can be established. • Using STEM diffraction to record the dataset is more efficient than TEM dark-field

Diffraction. Single crystal, magnetic

International Nuclear Information System (INIS)

Heger, G.

1999-01-01

The analysis of crystal structure and magnetic ordering is usually based on diffraction phenomena caused by the interaction of matter with X-rays, neutrons, or electrons. Complementary information is achieved due to the different character of X-rays, neutrons and electrons, and hence their different interactions with matter and further practical aspects. X-ray diffraction using conventional laboratory equipment and/or synchrotron installations is the most important method for structure analyses. The purpose of this paper is to discuss special cases, for which, in addition to this indispensable part, neutrons are required to solve structural problems. Even though the huge intensity of modern synchrotron sources allows in principle the study of magnetic X-ray scattering the investigation of magnetic structures is still one of the most important applications of neutron diffraction. (K.A.)

Infrared reflection properties and modelling of in situ reflection measurements on plasma-facing materials in Tore Supra

International Nuclear Information System (INIS)

Reichle, R; Desgranges, C; Faisse, F; Pocheau, C; Lasserre, J-P; Oelhoffen, F; Eupherte, L; Todeschini, M

2009-01-01

Tore Supra has-like ITER-reflecting internal surfaces, which can perturb the machine protection systems based on infrared (IR) thermography. To ameliorate this situation, we have measured and modelled in the 3-5 μm wavelength range the bi-directional reflection distribution function (BRDF) of wall material samples from Tore Supra and conducted in situ reflection measurements and simulated them with the CEA COSMOS code. BRDF results are presented for B 4 C and carbon fibre composite (CFC) tiles. The hemispherical integrated reflection ranges from 0.12 for the B 4 C sample to 0.39 for a CFC tile from the limiter erosion zone. In situ measurements of the IR reflection of a blackbody source off an ICRH and an LHCD antenna of Tore Supra are well reproduced by the simulation.

Infrared reflection properties and modelling of in situ reflection measurements on plasma-facing materials in Tore Supra

Energy Technology Data Exchange (ETDEWEB)

Reichle, R; Desgranges, C; Faisse, F; Pocheau, C [CEA, IRFM, F-13108 Saint-Paul-lez-Durance (France); Lasserre, J-P; Oelhoffen, F; Eupherte, L; Todeschini, M [CEA, DAM, CESTA, F-33114 Le Barp (France)

2009-12-15

Tore Supra has-like ITER-reflecting internal surfaces, which can perturb the machine protection systems based on infrared (IR) thermography. To ameliorate this situation, we have measured and modelled in the 3-5 {mu}m wavelength range the bi-directional reflection distribution function (BRDF) of wall material samples from Tore Supra and conducted in situ reflection measurements and simulated them with the CEA COSMOS code. BRDF results are presented for B{sub 4}C and carbon fibre composite (CFC) tiles. The hemispherical integrated reflection ranges from 0.12 for the B{sub 4}C sample to 0.39 for a CFC tile from the limiter erosion zone. In situ measurements of the IR reflection of a blackbody source off an ICRH and an LHCD antenna of Tore Supra are well reproduced by the simulation.

Low temperature electron microscopy and electron diffraction of the purple membrane of Halobacterium halobium

International Nuclear Information System (INIS)

Hayward, S.B.

1978-09-01

The structure of the purple membrane of Halobacterium halobium was studied by high resolution electron microscopy and electron diffraction, primarily at low temperature. The handedness of the purple membrane diffraction pattern with respect to the cell membrane was determined by electron diffraction of purple membranes adsorbed to polylysine. A new method of preparing frozen specimens was used to preserve the high resolution order of the membranes in the electron microscope. High resolution imaging of glucose-embedded purple membranes at room temperature was used to relate the orientation of the diffraction pattern to the absolute orientation of the structure of the bacteriorhodopsin molecule. The purple membrane's critical dose for electron beam-induced damage was measured at room temperature and at -120 0 C, and was found to be approximately five times greater at -120 0 C. Because of this decrease in radiation sensitivity, imaging of the membrane at low temperature should result in an increased signal-to-noise ratio, and thus better statistical definition of the phases of weak reflections. Higher resolution phases may thus be extracted from images than can be determined by imaging at room temperature. To achieve this end, a high resolution, liquid nitrogen-cooled stage was built for the JEOL-100B. Once the appropriate technology for taking low dose images at very high resolution has been developed, this stage will hopefully be used to determine the high resolution structure of the purple membrane

Time-Resolved Soft X-ray Diffraction Reveals Transient Structural Distortions of Ternary Liquid Crystals

Directory of Open Access Journals (Sweden)

Klaus Mann

2009-11-01

Full Text Available Home-based soft X-ray time-resolved scattering experiments with nanosecond time resolution (10 ns and nanometer spatial resolution were carried out at a table top soft X-ray plasma source (2.2–5.2 nm. The investigated system was the lyotropic liquid crystal C16E7/paraffin/glycerol/formamide/IR 5. Usually, major changes in physical, chemical, and/or optical properties of the sample occur as a result of structural changes and shrinking morphology. Here, these effects occur as a consequence of the energy absorption in the sample upon optical laser excitation in the IR regime. The liquid crystal shows changes in the structural response within few hundred nanoseconds showing a time decay of 182 ns. A decrease of the Bragg peak diffracted intensity of 30% and a coherent macroscopic movement of the Bragg reflection are found as a response to the optical pump. The Bragg reflection movement is established to be isotropic and diffusion controlled (1 μs. Structural processes are analyzed in the Patterson analysis framework of the time-varying diffraction peaks revealing that the inter-lamellar distance increases by 2.7 Å resulting in an elongation of the coherently expanding lamella crystallite. The present studies emphasize the possibility of applying TR-SXRD techniques for studying the mechanical dynamics of nanosystems.

Tomography with energy dispersive diffraction

Science.gov (United States)

Stock, S. R.; Okasinski, J. S.; Woods, R.; Baldwin, J.; Madden, T.; Quaranta, O.; Rumaiz, A.; Kuczewski, T.; Mead, J.; Krings, T.; Siddons, P.; Miceli, A.; Almer, J. D.

2017-09-01

X-ray diffraction can be used as the signal for tomographic reconstruction and provides a cross-sectional map of the crystallographic phases and related quantities. Diffraction tomography has been developed over the last decade using monochromatic x-radiation and an area detector. This paper reports tomographic reconstruction with polychromatic radiation and an energy sensitive detector array. The energy dispersive diffraction (EDD) geometry, the instrumentation and the reconstruction process are described and related to the expected resolution. Results of EDD tomography are presented for two samples containing hydroxyapatite (hAp). The first is a 3D-printed sample with an elliptical crosssection and contains synthetic hAp. The second is a human second metacarpal bone from the Roman-era cemetery at Ancaster, UK and contains bio-hAp which may have been altered by diagenesis. Reconstructions with different diffraction peaks are compared. Prospects for future EDD tomography are also discussed.

Three-dimensional particle tracking in concave structures made by ultraviolet nanoimprint via total internal reflection fluorescence microscopy and refractive-index-matching method

Science.gov (United States)

Fujinami, Taku; Kigami, Hiroshi; Unno, Noriyuki; Taniguchi, Jun; Satake, Shin-ichi

2018-03-01

Total internal reflection fluorescence microscopy (TIRFM) is a promising method for measuring fluid flow close to a wall with nanoscale resolution in a process that is termed "multilayer nanoparticle image velocimetry" (MnPIV). TIRFM uses evanescent light that is generated on a substrate (typically a glass slide) by total internal reflection of light. Many researchers have previously studied x-y-z (3D) flows of water close to flat glass slides using MnPIV. On the other hand, a fluid flow close to a structured surface is also important. To measure flows of water near micro-patterns, we previously developed an MnPIV technique that uses a refractive-index-matching method. In previous study, the micropattern is made of a thermoplastic material with a refractive index that closely matches that of water. In this study, ultraviolet nanoimprint lithography was used for fabricating the appropriate micro-patterns because this technique can fabricate a pattern with a high resolution. As a result, we succeeded in performing MnPIV in water with a circular hole array pattern made by ultraviolet nanoimprint using a refractive-index-matching method. We believe that this technique will be helpful in elucidating fluid flows around microstructures.

Darkfield adapter for whole slide imaging: adapting a darkfield internal reflection illumination system to extend WSI applications.

Directory of Open Access Journals (Sweden)

Yoshihiro Kawano

Full Text Available We present a new method for whole slide darkfield imaging. Whole Slide Imaging (WSI, also sometimes called virtual slide or virtual microscopy technology, produces images that simultaneously provide high resolution and a wide field of observation that can encompass the entire section, extending far beyond any single field of view. For example, a brain slice can be imaged so that both overall morphology and individual neuronal detail can be seen. We extended the capabilities of traditional whole slide systems and developed a prototype system for darkfield internal reflection illumination (DIRI. Our darkfield system uses an ultra-thin light-emitting diode (LED light source to illuminate slide specimens from the edge of the slide. We used a new type of side illumination, a variation on the internal reflection method, to illuminate the specimen and create a darkfield image. This system has four main advantages over traditional darkfield: (1 no oil condenser is required for high resolution imaging (2 there is less scatter from dust and dirt on the slide specimen (3 there is less halo, providing a more natural darkfield contrast image, and (4 the motorized system produces darkfield, brightfield and fluorescence images. The WSI method sometimes allows us to image using fewer stains. For instance, diaminobenzidine (DAB and fluorescent staining are helpful tools for observing protein localization and volume in tissues. However, these methods usually require counter-staining in order to visualize tissue structure, limiting the accuracy of localization of labeled cells within the complex multiple regions of typical neurohistological preparations. Darkfield imaging works on the basis of light scattering from refractive index mismatches in the sample. It is a label-free method of producing contrast in a sample. We propose that adapting darkfield imaging to WSI is very useful, particularly when researchers require additional structural information without the

Digital diffractive optics: Have diffractive optics entered mainstream industry yet?

Science.gov (United States)

Kress, Bernard; Hejmadi, Vic

2010-05-01

When a new technology is integrated into industry commodity products and consumer electronic devices, and sold worldwide in retail stores, it is usually understood that this technology has then entered the realm of mainstream technology and therefore mainstream industry. Such a leap however does not come cheap, as it has a double edge sword effect: first it becomes democratized and thus massively developed by numerous companies for various applications, but also it becomes a commodity, and thus gets under tremendous pressure to cut down its production and integration costs while not sacrificing to performance. We will show, based on numerous examples extracted from recent industry history, that the field of Diffractive Optics is about to undergo such a major transformation. Such a move has many impacts on all facets of digital diffractive optics technology, from the optical design houses to the micro-optics foundries (for both mastering and volume replication), to the final product integrators or contract manufacturers. The main causes of such a transformation are, as they have been for many other technologies in industry, successive technological bubbles which have carried and lifted up diffractive optics technology within the last decades. These various technological bubbles have been triggered either by real industry needs or by virtual investment hype. Both of these causes will be discussed in the paper. The adjective ""digital"" in "digital diffractive optics" does not refer only, as it is done in digital electronics, to the digital functionality of the element (digital signal processing), but rather to the digital way they are designed (by a digital computer) and fabricated (as wafer level optics using digital masking techniques). However, we can still trace a very strong similarity between the emergence of micro-electronics from analog electronics half a century ago, and the emergence of digital optics from conventional optics today.

Determination of the hexagonal network parameters of the quartz β using neutron multiple diffraction

International Nuclear Information System (INIS)

Campos, L.C.; Parente, C.B.R.; Mazzocchi, V.L.; Helene, O.

2000-01-01

In this work, neutron multiple diffraction is employed for the determination of the parameters a and c of the β-quartz hexagonal cell. This crystalline phase of silica (SiO 2 ) occurs in temperatures between ca. 846 and 1143 K. A β-quartz neutron multiple diffraction pattern has been used in the determinations. This pattern was obtained with a natural quartz single crystal heated to 1003 K. During the indexing of the pattern it was verified that most of the pairs of secondary reflections, which are responsible for the formation of peaks, could be classified as 'good for the determination of a' or 'good for the determination of c'. With this classification, it became possible to employ an iterative method for the determination of both parameters. After 8 cycles of iteration the values found for the parameters were a = 4.9964 +- 0.0018 and c = 5.46268 +- 0.00052 A. (author)

Mechanical properties of phases in austeno-ferritic duplex stainless steel-Surface stresses studied by X-ray diffraction

International Nuclear Information System (INIS)

Dakhlaoui, Rim; Braham, Chedly; Baczmanski, Andrzej

2007-01-01

In this work the parameters characterizing the individual elastoplastic mechanical behaviour of each phase in austeno-ferritic duplex stainless steels are determined by using X-ray diffraction during a uniaxial tensile test. The interpretation of the experimental data is based on the diffraction elastic constants calculated by the self-consistent model taking the anisotropy of the studied materials into account. The elastoplastic model is used to predict the evolution of the internal stresses during loading, and to identify the critical resolved shear stresses and strain hardening parameters of the material. The effect of the chemical composition on the individual elastoplastic behaviour of the studied phases is established by comparing results from three different samples. Finally, the X-ray diffraction results are compared with those previously obtained by using neutron radiation

Reflectance spectroscopy of PMMA implanted with 50 keV silicon ions

Energy Technology Data Exchange (ETDEWEB)

Florian, Bojana [Bulgarian Institute of Metrology, 2 Prof. P. Mutafchiev Str., 1797 Sofia (Bulgaria); Stefanov, Ivan [Department of Quantum Electronics, Faculty of Physics, Sofia University, 5 James Bourchier Blvd., 1164 Sofia (Bulgaria); Hadjichristov, Georgi [Institute of Solid State Physics, 72 Tzarigradsko Chaussee Blvd., 1784 Sofia (Bulgaria)

2009-07-01

Recently, the modification of the specular reflectivity of PMMA implanted with low-energy (50 keV) silicon ions was studied and nano-clusters formed in PMMA by Si{sup +} implantation were evidenced by Raman spectroscopy and electrical measurements. Further, the optical loss due to off-specular (diffuse) reflectivity of this ion-implanted polymer is also of practical interest for applications such as micro-optical lenses, diffraction gratings, Fresnel lenses, waveguides, etc. We examined both specular and diffuse reflectivity of Si{sup +} implanted PMMA in the UV-Vis-NIR. The effect from Si{sup +} implantation in the dose range 10{sup 14}-10{sup 17} ions/cm{sup 2} is linked to the structure formed in PMMA where the buried ion-implanted layer has a thickness up to 100 nm. As compared to the pristine PMMA, an enhancement of the reflectivity of Si{sup +} implanted PMMA is observed, that is attributed to the modification of the subsurface region of PMMA upon the ion implantation.

Analysis of an anti-reflecting nanowire transparent electrode for solar cells

Science.gov (United States)

Zhao, Zhexin; Wang, Ken Xingze; Fan, Shanhui

2017-03-01

Transparent electrodes are an important component in many optoelectronic devices, especially solar cells. In this paper, we investigate a nanowire transparent electrode that also functions as an anti-reflection coating for silicon solar cells, taking into account the practical constraints that the electrode is typically encapsulated and needs to be in electric contact with the semiconductor. Numerical simulations show that the electrode can provide near-perfect broadband anti-reflection over much of the frequency range above the silicon band gap for both polarizations while keeping the sheet resistance sufficiently low. To provide insights into the physics mechanism of this broadband anti-reflection, we introduce a generalized Fabry-Perot model, which captures the effects of the higher order diffraction channels as well as the modification of the reflection coefficient of the interface introduced by the nanowires. This model is validated using frequency-domain electromagnetic simulations. Our work here provides design guidelines for nanowire transparent electrode in a device configuration that is relevant for solar cell applications.

Computer Simulation of Diffraction Patterns.

Science.gov (United States)

Dodd, N. A.

1983-01-01

Describes an Apple computer program (listing available from author) which simulates Fraunhofer and Fresnel diffraction using vector addition techniques (vector chaining) and allows user to experiment with different shaped multiple apertures. Graphics output include vector resultants, phase difference, diffraction patterns, and the Cornu spiral…

Diffraction limit of refractive compound lens

International Nuclear Information System (INIS)

Kolchevsky, N.N.; Petrov, P.V.

2015-01-01

A compound X-ray and neutron lenses is an array of lenses with a common axis. The resolution limited by aberration and by diffraction. Diffraction limit comes from theory based on absorption aperture of the compound refractive lenses. Beam passing through transparent lenses form Airy pattern. Results of calculation of diffraction resolution limit for non-transparent X-ray and neutron lenses are discussed. (authors)

Deep-inelastic electron-proton diffraction

International Nuclear Information System (INIS)

Dainton, J.B.

1995-11-01

Recent measurements by the H1 collaboration at HERA of the cross section for deep-inelastic electron-proton scattering in which the proton interacts with minimal energy transfer and limited 4-momentum transfer squared are presented in the form of the contribution F 2 D(3) to the proton structure function F 2 . By parametrising the cross section phenomenologically in terms of a leading effective Regge pole exchange and comparing the result with a similar parametrisation of hadronic pp physics, the proton interaction is demonstrated to be dominantly of a diffractive nature. The quantitative interpretation of the parametrisation in terms of the properties of an effective leading Regge pole exchange, the pomeron (IP), shows that there is no evidence for a 'harder' BFKL-motivated IP in such deep-inelastic proton diffraction. The total contribution of proton diffraction to deep-inelastic electron-proton scattering is measured to be ∝10% and to be rather insensitive to Bjorken-x and Q 2 . A first measurement of the partonic structure of diffractive exchange is presented. It is shown to be readily interpreted in terms of the exchange of gluons, and to suggest that the bulk of diffractive momentum transfer is carried by a leading gluon. (orig.)

International Relations

OpenAIRE

McGlinchey, S.

2017-01-01

A ‘Day 0’ introduction to International Relations for beginners. Written by a range of emerging and established experts, the chapters offer a broad sweep of the basic components of International Relations and the key contemporary issues that concern the discipline. The narrative arc forms a complete circle, taking readers from no knowledge to competency. The journey starts by examining how the international system was formed and ends by reflecting that International Relations is always adapti...

At-wavelength interferometry of high-NA diffraction-limited EUV optics