X-ray analysis of a single aerosol particle with combination of scanning electron microscope and synchrotron radiation X-ray microscope

International Nuclear Information System (INIS)

Toyoda, Masatoshi; Kaibuchi, Kazuki; Nagasono, Mitsuru; Terada, Yasuko; Tanabe, Teruo; Hayakawa, Shinjiro; Kawai, Jun

2004-01-01

We developed a microscope by a combination of synchrotron radiation X-ray fluorescence (SR-XRF) microscope and scanning electron microscope (SEM) with an energy dispersive X-ray spectrometer (EDX). SR-XRF is appropriate to detect trace and micro amount of elements and sensitive to heavy elements in an analyte but it cannot observe the real time image. SEM-EDX can observe the secondary electron image of a single particle in real time and is appropriate to detect lighter elements. This combination microscope can ensure the identification of the XRF spectrum to the SEM image without transferring the sample. For aerosol analysis, it is important to analyze each particle. The present method makes feasible to analyze not only the average elemental composition as the total particles but also elemental composition of each particle, which is dependent on the particle shape and size. The microscope was applied to an individual aerosol particle study. The X-ray spectra were different among the particles, but also different between SR-XRF and SEM-EDX for the same particle, due to the difference in fluorescence yields between X-ray excitation and electron excitation

Epoxy replication for Wolter x-ray microscope fabrication

International Nuclear Information System (INIS)

Priedhorsky, W.

1981-01-01

An epoxy replica of a test piece designed to simulate a Wolter x-ray microscope geometry showed no loss of x-ray reflectivity or resolution, compared to the original. The test piece was a diamond-turned cone with 1.5 0 half angle. A flat was fly-cut on one side, then super- and conventionally polished. The replica was separated at the 1.5 0 -draft angle, simulating a shallow angle Wolter microscope geometry. A test with 8.34 A x rays at 0.9 0 grazing angle showed a reflectivity of 67% for the replica flat surface, and 70% for the original. No spread of the reflected beam was observed with a 20-arc second wide test beam. This test verifies the epoxy replication technique for production of Wolter x-ray microscopes

Progress in x-ray microanalysis in the analytical electron microscope

International Nuclear Information System (INIS)

Williams, D.B.

1987-01-01

Analytical electron microscopes (AEM) consisting of x-ray energy dispersive spectrometers (EDS) interfaced to scanning transmission electron microscopes have been available for more than a decade. During that time, progress towards reaching the fundamental limits of the technique has been slow. The progress of x-ray microanalysis in AEM is examined in terms of x-ray detector technology; the EDS/AEM interface; accuracy of microanalysis; and spatial resolution and detectability limits. X-ray microanalysis in the AEM has substantial room for improvement in terms of the interface between the detector and the microscope. Advances in microscope design and software should permit 10nm resolution with detectability limits approaching 0.01wt percent. 16 refs., 2 figs., 1 tab

Adjustable Grazing-Incidence X-Ray Optics

Science.gov (United States)

O'Dell, Stephen L.; Reid, Paul B.

2015-01-01

With its unique subarcsecond imaging performance, NASA's Chandra X-ray Observatory illustrates the importance of fine angular resolution for x-ray astronomy. Indeed, the future of x-ray astronomy relies upon x-ray telescopes with comparable angular resolution but larger aperture areas. Combined with the special requirements of nested grazing-incidence optics, mass, and envelope constraints of space-borne telescopes render such advances technologically and programmatically challenging. The goal of this technology research is to enable the cost-effective fabrication of large-area, lightweight grazing-incidence x-ray optics with subarcsecond resolution. Toward this end, the project is developing active x-ray optics using slumped-glass mirrors with thin-film piezoelectric arrays for correction of intrinsic or mount-induced distortions.

Compact scanning transmission x-ray microscope at the photon factory

International Nuclear Information System (INIS)

Takeichi, Yasuo; Inami, Nobuhito; Ono, Kanta; Suga, Hiroki; Takahashi, Yoshio

2016-01-01

We report the design and performance of a compact scanning transmission X-ray microscope developed at the Photon Factory. Piezo-driven linear stages are used as coarse stages of the microscope to realize excellent compactness, mobility, and vibrational and thermal stability. An X-ray beam with an intensity of ∼10 7 photons/s was focused to a diameter of ∼40 nm at the sample. At the soft X-ray undulator beamline used with the microscope, a wide range of photon energies (250–1600 eV) is available. The microscope has been used to research energy materials and in environmental sciences

Imaging properties and its improvements of scanning/imaging x-ray microscope

International Nuclear Information System (INIS)

Takeuchi, Akihisa; Uesugi, Kentaro; Suzuki, Yoshio

2016-01-01

A scanning / imaging X-ray microscope (SIXM) system has been developed at SPring-8. The SIXM consists of a scanning X-ray microscope with a one-dimensional (1D) X-ray focusing device and an imaging (full-field) X-ray microscope with a 1D X-ray objective. The motivation of the SIXM system is to realize a quantitative and highly-sensitive multimodal 3D X-ray tomography by taking advantages of both the scanning X-ray microscope using multi-pixel detector and the imaging X-ray microscope. Data acquisition process of a 2D image is completely different between in the horizontal direction and in the vertical direction; a 1D signal is obtained with the linear-scanning while the other dimensional signal is obtained with the imaging optics. Such condition have caused a serious problem on the imaging properties that the imaging quality in the vertical direction has been much worse than that in the horizontal direction. In this paper, two approaches to solve this problem will be presented. One is introducing a Fourier transform method for phase retrieval from one phase derivative image, and the other to develop and employ a 1D diffuser to produce an asymmetrical coherent illumination

Uniformity of the soft-x-ray emissions from gold foils irradiated by OMEGA laser beams determined by a two-mirror normal-incidence microscope with multilayer coatings

International Nuclear Information System (INIS)

Seely, John F.; Boehly, Thomas; Pien, Gregory; Bradley, David

1998-01-01

A two-mirror normal-incidence microscope with multilayer coatings was used to image the soft-x-ray emissions from planar foils irradiated by OMEGA laser beams. The bandpass of the multilayer coatings was centered at a wavelength of 48.3 Angstrom (257-eV energy) and was 0.5 Angstrom wide. Five overlapping OMEGA beams, without beam smoothing, were typically incident on the gold foils. The total energy was 1500 J, and the focused intensity was 6x10 13 Wcm -2 . The 5.8x magnified images were recorded by a gated framing camera at various times during the 3-ns laser pulse. A pinhole camera imaged the x-ray emission in the energy range of >2 keV. On a spatial scale of 10 μm, it was found that the soft-x-ray images at 257 eV were quite uniform and featureless. In contrast, the hard-x-ray images in the energy range of >2 kev were highly nonuniform with numerous features of size 150 μm. copyright 1998 Optical Society of America

Three-dimensional phase-contrast X-ray microtomography with scanning–imaging X-ray microscope optics

International Nuclear Information System (INIS)

Takeuchi, Akihisa; Uesugi, Kentaro; Suzuki, Yoshio

2013-01-01

A novel three-dimensional X-ray microtomographic micro-imaging system which enables simultaneous measurement of differential phase contrast and absorption contrast has been developed. The optical system consists of a scanning microscope with one-dimensional focusing device and an imaging microscope with one-dimensional objective. A three-dimensional (3D) X-ray tomographic micro-imaging system has been developed. The optical system is based on a scanning–imaging X-ray microscope (SIXM) optics, which is a hybrid system consisting of a scanning microscope optics with a one-dimensional (1D) focusing (line-focusing) device and an imaging microscope optics with a 1D objective. In the SIXM system, each 1D dataset of a two-dimensional (2D) image is recorded independently. An object is illuminated with a line-focused beam. Positional information of the region illuminated by the line-focused beam is recorded with the 1D imaging microscope optics as line-profile data. By scanning the object with the line focus, 2D image data are obtained. In the same manner as for a scanning microscope optics with a multi-pixel detector, imaging modes such as phase contrast and absorption contrast can be arbitrarily configured after the image data acquisition. By combining a tomographic scan method and the SIXM system, quantitative 3D imaging is performed. Results of a feasibility study of the SIXM for 3D imaging are shown

On-axis microscopes for the inelastic x-ray scattering beamline at NSLS-II

Energy Technology Data Exchange (ETDEWEB)

Gofron, K. J., E-mail: kgofron@bnl.gov; Cai, Y. Q.; Coburn, D. S.; Antonelli, S.; Suvorov, A. [National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973 (United States); Flores, J. [Department of Physics and Astronomy, Stony Brook University, NY 11794 (United States)

2016-07-27

A novel on-axis X-ray microscope with 3 µm resolution, 3x magnification, and a working distance of 600 mm for in-situ sample alignment and X-ray beam visualization for the Inelastic X-ray Scattering (IXS) beamline at NSLS-II is presented. The microscope uses reflective optics, which minimizes dispersion, and allows imaging from Ultraviolet (UV) to Infrared (IR) with specifically chosen objective components (coatings, etc.). Additionally, a portable high resolution X-ray microscope for KB mirror alignment and X-ray beam characterization was developed.

Overview of nanoscale NEXAFS performed with soft X-ray microscopes

Directory of Open Access Journals (Sweden)

Peter Guttmann

2015-02-01

Full Text Available Today, in material science nanoscale structures are becoming more and more important. Not only for the further miniaturization of semiconductor devices like carbon nanotube based transistors, but also for newly developed efficient energy storage devices, gas sensors or catalytic systems nanoscale and functionalized materials have to be analysed. Therefore, analytical tools like near-edge X-ray absorption fine structure (NEXAFS spectroscopy has to be applied on single nanostructures. Scanning transmission X-ray microscopes (STXM as well as full-field transmission X-ray microscopes (TXM allow the required spatial resolution to study individual nanostructures. In the soft X-ray energy range only STXM was used so far for NEXAFS studies. Due to its unique setup, the TXM operated by the Helmholtz-Zentrum Berlin (HZB at the electron storage ring BESSY II is the first one in the soft X-ray range which can be used for NEXAFS spectroscopy studies which will be shown in this review. Here we will give an overview of the different microscopes used for NEXAFS studies and describe their advantages and disadvantages for different samples.

Overview of nanoscale NEXAFS performed with soft X-ray microscopes.

Science.gov (United States)

Guttmann, Peter; Bittencourt, Carla

2015-01-01

Today, in material science nanoscale structures are becoming more and more important. Not only for the further miniaturization of semiconductor devices like carbon nanotube based transistors, but also for newly developed efficient energy storage devices, gas sensors or catalytic systems nanoscale and functionalized materials have to be analysed. Therefore, analytical tools like near-edge X-ray absorption fine structure (NEXAFS) spectroscopy has to be applied on single nanostructures. Scanning transmission X-ray microscopes (STXM) as well as full-field transmission X-ray microscopes (TXM) allow the required spatial resolution to study individual nanostructures. In the soft X-ray energy range only STXM was used so far for NEXAFS studies. Due to its unique setup, the TXM operated by the Helmholtz-Zentrum Berlin (HZB) at the electron storage ring BESSY II is the first one in the soft X-ray range which can be used for NEXAFS spectroscopy studies which will be shown in this review. Here we will give an overview of the different microscopes used for NEXAFS studies and describe their advantages and disadvantages for different samples.

X-ray optics and X-ray microscopes: new challenges

International Nuclear Information System (INIS)

Susini, J.

2004-01-01

Soon after the discovery of X-rays in 1895 by W. Roentgen, it became rapidly clear that the methods traditionally used in the visible light regime, namely refraction, diffraction and reflection were difficult to apply for X-ray optics. The physical origins of these difficulties are closely linked to the very nature of interaction of X-rays with matter. The small deviation δ of the refractive index of condensed matter from unity makes it difficult to extend refraction-based optics from the optical spectral region to the X-ray region because the refraction angle is proportional to δ. Similarly it is very challenging to extend diffraction-based focusing techniques to X-rays because the diffraction angle scales inversely with wavelength. Finally, the use of reflection-based optics is also limited by the very small critical angle for total reflection. All those fundamental limitations prevented for almost one century, the development of X-ray microscopy whereas electron microscopy became a standard tool. In the past twenty years, interests for X-ray microscopy revived, mainly because of several major advances in X-ray sources and X-ray optics. X-ray microscopy techniques are now emerging as powerful and complementary tools for submicron investigations. Soft X-ray microscopes offer traditionally the possibility to form direct images of thick hydrated biological material in near-native environment, at a spatial resolution well beyond that achievable with visible light microscopy. Natural contrast is available in the soft X-ray region, in the so-called ''water-window'', due to the presence of absorption edges of the major constituents (C,N,O). Recent advances in manufacturing techniques have enlarged the accessible energy range of micro-focussing optics and offer new applications in a broad range of disciplines. X-ray microscopy in the 1 - 30 keV energy range is better suited for fluorescence to map trace elements, tomography for 3D imaging and micro-diffraction. The

Interferometric and optical tests of water window imaging x ray microscopes

Science.gov (United States)

Johnson, R. Barry

1993-01-01

Interferometric tests of Schwarzchild X-ray Microscope are performed to evaluate the optical properties and alignment of the components. Photographic measurements of the spatial resolution, focal properties, and vignetting characteristics of the prototype Water Window Imaging X-ray Microscope are made and analyzed.

First application experiments with the Stockholm compact soft x-ray microscope

International Nuclear Information System (INIS)

Bertilson, M; Hofsten, O von; Lindblom, M; Holmberg, A; Takman, P; Vogt, U; Hertz, H; Thieme, J

2009-01-01

Most soft x-ray microscopes operating in the water window (λ = 2.3 - 4.4 nm) rely on synchrotron radiation sources. In the future we believe scientists will use soft x-ray microscopes as one imaging tool among others in their own laboratory. For this purpose we have developed a full field soft x-ray microscope with a laser-plasma source compact enough to fit on an optical table. In this contribution we describe the current status of this microscope now featuring stable operation at λ = 3.37 nm or λ 2.48 nm. In-house fabricated single element zone plates offering the possibility to perform phase contrast imaging have been implemented. We also report on the first application experiments for compact soft x-ray microscopy, including results from studies of clay minerals and colloids existing in nature and results from phase optics experiments. Planned upgrades of the microscope include increasing the source brightness, implementing more efficient condenser optics, and installing a cryo sample stage for tomography. These improvements will open up for further applications, especially in the field of biological imaging.

Development of full-field x-ray phase-tomographic microscope based on laboratory x-ray source

Science.gov (United States)

Takano, H.; Wu, Y.; Momose, A.

2017-09-01

An X-ray phase tomographic microscope that can quantitatively measure the refractive index of a sample in three dimensions with a high spatial resolution was developed by installing a Lau interferometer consisting of an absorption grating and a π/2 phase grating into the optics of an X-ray microscope. The optics comprises a Cu rotating anode X-ray source, capillary condenser optics, and a Fresnel zone plate for the objective. The microscope has two optical modes: a large-field-of-view mode (field of view: 65 μm x 65 μm) and a high-resolution mode (spatial resolution: 50 nm). Optimizing the parameters of the interferometer yields a self-image of the phase grating with 60% visibility. Through the normal fringe-scanning measurement, a twin phase image, which has an overlap of two phase image of opposite contrast with a shear distance much larger than system resolution, is generated. Although artifacts remain to some extent currently when a phase image is calculated from the twin phase image, this system can obtain high-spatial-resolution images resolving 50-nm structures. Phase tomography with this system has also been demonstrated using a phase object.

Development of the water window imaging x-ray microscope

International Nuclear Information System (INIS)

Hoover, R.B.; Shealy, D.L.; Baker, P.C.; Barbee, T.W. Jr.; Walker, A.B.C. Jr.

1991-01-01

This paper reports on the Water Window Imaging X-ray Microscopy which is currently being developed by a consortium from the Marshall Space Flight Center, the University of Alabama at Birmingham, Baker Consulting, the Lawrence Livermore National Laboratory, and Stanford University. The high quality solar images achieved during the Stanford/MSFC/LLNL Rocket X-ray Spectroheliograph flight conclusively established that excellent imaging could be obtained with doubly reflecting multilayer optical systems. Theoretical studies carried out as part of the MSFC X-ray Microscopy Program, demonstrated that high quality, high resolution multilayer x-ray imaging microscopes could be achieved with spherical optics in the Schwarzschild configuration and with Aspherical optical systems. Advanced Flow Polishing methods have been used to fabricate substrates for multilayer optics. On hemlite grade Sapphire, the authors have achieved microscopy mirror substrates on concave and convex spherical surfaces with 0.5 Angstrom rms surface smoothness, as measured by the Zygo profilometer. In this paper the authors report on the current status of fabrication and testing of the optical and mechanical subsystems for the Water Window Imaging X-ray Microscope

A high-energy x-ray microscope for inertial confinement fusion

International Nuclear Information System (INIS)

Marshall, F.J.; Bennett, G.R.

1999-01-01

We have developed a microscope capable of imaging x-ray emission from inertial confinement fusion targets in the range of 7 - 9 keV. Imaging is accomplished with a Kirkpatrick-Baez type, four-image microscope coated with a WB 4 C multilayer having a 2d period of 140 Angstrom. This microscope design (a standard used on the University of Rochester close-quote s OMEGA laser system) is capable of 5 μm resolution over a region large enough to image an imploded target (∼400 μm). This design is capable of being extended to ∼40 keV if state-of-the-art, short-spacing, multilayer coatings are used (∼25 Angstrom), and has been configured to obtain 3 μm resolution with the appropriate choice of mirror size. As such, this type of microscope could serve as a platform for multiframe, hard x-ray imaging on the National Ignition Facility. Characterization of the microscope and laboratory measurements of the energy response made with a cw x-ray source will be shown. copyright 1999 American Institute of Physics

A combined scanning tunnelling microscope and x-ray interferometer

Science.gov (United States)

Yacoot, Andrew; Kuetgens, Ulrich; Koenders, Ludger; Weimann, Thomas

2001-10-01

A monolithic x-ray interferometer made from silicon and a scanning tunnelling microscope have been combined and used to calibrate grating structures with periodicities of 100 nm or less. The x-ray interferometer is used as a translation stage which moves in discrete steps of 0.192 nm, the lattice spacing of the silicon (220) planes. Hence, movements are traceable to the definition of the metre and the nonlinearity associated with the optical interferometers used to measure displacement in more conventional metrological scanning probe microscopes (MSPMs) removed.

Hard X-ray Microscopic Imaging Of Human Breast Tissues

Science.gov (United States)

Park, Sung H.; Kim, Hong T.; Kim, Jong K.; Jheon, Sang H.; Youn, Hwa S.

2007-01-01

X-ray microscopy with synchrotron radiation will be a useful tool for innovation of x-ray imaging in clinical and laboratory settings. It helps us observe detailed internal structure of material samples non-invasively in air. And, it also has the potential to solve some tough problems of conventional breast imaging if it could evaluate various conditions of breast tissue effectively. A new hard x-ray microscope with a spatial resolution better than 100 nm was installed at Pohang Light Source, a third generation synchrotron radiation facility in Pohang, Korea. The x-ray energy was set at 6.95 keV, and the x-ray beam was monochromatized by W/B4C monochromator. Condenser and objective zone plates were used as x-ray lenses. Zernike phase plate next to condenser zone plate was introduced for improved contrast imaging. The image of a sample was magnified 30 times by objective zone plate and 20 times by microscope objective, respectively. After additional 10 times digital magnification, the total magnifying power was up to 6000 times in the end. Phase contrast synchrotron images of 10-μm-thick female breast tissue of the normal, fibroadenoma, fibrocystic change and carcinoma cases were obtained. By phase contrast imaging, hard x-rays enable us to observe many structures of breast tissue without sample preparations such as staining or fixation.

Hard X-ray Microscopic Imaging Of Human Breast Tissues

International Nuclear Information System (INIS)

Park, Sung H.; Kim, Hong T.; Kim, Jong K.; Jheon, Sang H.; Youn, Hwa S.

2007-01-01

X-ray microscopy with synchrotron radiation will be a useful tool for innovation of x-ray imaging in clinical and laboratory settings. It helps us observe detailed internal structure of material samples non-invasively in air. And, it also has the potential to solve some tough problems of conventional breast imaging if it could evaluate various conditions of breast tissue effectively. A new hard x-ray microscope with a spatial resolution better than 100 nm was installed at Pohang Light Source, a third generation synchrotron radiation facility in Pohang, Korea. The x-ray energy was set at 6.95 keV, and the x-ray beam was monochromatized by W/B4C monochromator. Condenser and objective zone plates were used as x-ray lenses. Zernike phase plate next to condenser zone plate was introduced for improved contrast imaging. The image of a sample was magnified 30 times by objective zone plate and 20 times by microscope objective, respectively. After additional 10 times digital magnification, the total magnifying power was up to 6000 times in the end. Phase contrast synchrotron images of 10-μm-thick female breast tissue of the normal, fibroadenoma, fibrocystic change and carcinoma cases were obtained. By phase contrast imaging, hard x-rays enable us to observe many structures of breast tissue without sample preparations such as staining or fixation

Simulation of high-resolution X-ray microscopic images for improved alignment

International Nuclear Information System (INIS)

Song Xiangxia; Zhang Xiaobo; Liu Gang; Cheng Xianchao; Li Wenjie; Guan Yong; Liu Ying; Xiong Ying; Tian Yangchao

2011-01-01

The introduction of precision optical elements to X-ray microscopes necessitates fine realignment to achieve optimal high-resolution imaging. In this paper, we demonstrate a numerical method for simulating image formation that facilitates alignment of the source, condenser, objective lens, and CCD camera. This algorithm, based on ray-tracing and Rayleigh-Sommerfeld diffraction theory, is applied to simulate the X-ray microscope beamline U7A of National Synchrotron Radiation Laboratory (NSRL). The simulations and imaging experiments show that the algorithm is useful for guiding experimental adjustments. Our alignment simulation method is an essential tool for the transmission X-ray microscope (TXM) with optical elements and may also be useful for the alignment of optical components in other modes of microscopy.

Development of laser plasma x-ray microscope for living hydrated biological specimens

International Nuclear Information System (INIS)

Kado, Masataka; Daido, Hiroyuki

2005-01-01

Investigating the structure and the function of life object performing advanced life activity becomes important. In order to investigate the life object, it is necessary to observe living specimens with high spatial resolution and high temporal resolution. Since laser plasma x-ray source has high brightness and short pulse duration, x-ray microscope with the laser plasma x-ray source makes possible to observe living specimens. Such as chromosomes, macrophages, bacterium, and so on have been observed by contact x-ray microscopy. The x-ray images obtained by indirect measurements such as the contact x-ray microscopy have difficulty to avoid artificial effect such as irregular due to developing process. Development of an x-ray microscope with laser plasma x-ray source is necessary to avoid such defects. (author)

Ellipsoidal and parabolic glass capillaries as condensers for x-ray microscopes

International Nuclear Information System (INIS)

Zeng Xianghui; Duewer, Fred; Feser, Michael; Huang, Carson; Lyon, Alan; Tkachuk, Andrei; Yun Wenbing

2008-01-01

Single-bounce ellipsoidal and paraboloidal glass capillary focusing optics have been fabricated for use as condenser lenses for both synchrotron and tabletop x-ray microscopes in the x-ray energy range of 2.5-18 keV. The condenser numerical apertures (NAs) of these devices are designed to match the NA of x-ray zone plate objectives, which gives them a great advantage over zone plate condensers in laboratory microscopes. The fabricated condensers have slope errors as low as 20 μrad rms. These capillaries provide a uniform hollow-cone illumination with almost full focusing efficiency, which is much higher than what is available with zone plate condensers. Sub-50 nm resolution at 8 keV x-ray energy was achieved by utilizing this high-efficiency condenser in a laboratory microscope based on a rotating anode generator

Project of a photoelectron X-ray microscope on ACO storage ring

International Nuclear Information System (INIS)

Polack, F.; Lowenthal, S.

1983-01-01

A photoelectron X-ray microscope is described which is based on the principles of contact X-ray imaging and of image converters. An X-ray image is projected by a parallel X-ray beam on a thin transmission photocathode. The emitted electrons are accelerated and imaged at large magnification by an emission microscope. The instrument, which is presently under construction, is designed to provide high resolution. An electron velocity filter has been added to the usual cross-over aperture so as to reduce the spherochromatic aberration, and the cathode lens has been designed to reduce field curvature. Resolution and detection efficiency of Au and CsI cathodes are compared. The interest of the instrument for soft X-ray microscopy is briefly discussed. (orig.)

Ellipsoidal capillary as condenser for the BESSY full-field x-ray microscope

International Nuclear Information System (INIS)

Guttmann, P; Heim, S; Schneider, G; Zeng, X; Feser, M; Yun, W

2009-01-01

The BESSY x-ray microscopy group has developed a new full-field x-ray microscope which employs an advanced x-ray optical concept. Traditionally, zone plate based condensers are used in x-ray microscopes providing an energy resolution of only E/ΔE ≤ 500. In addition, this conventional monochromator concept requires a pinhole close to the sample restricting the available space for tomography applications. In our new BESSY microscope, a standard monochromator beam line provides a high energy resolution of up to 10,000 which permits NEXAFS studies. An elliptically shaped mono-capillary is used to form the hollow cone illumination necessary for sample illumination and to match the aperture of the objective. Calculations regarding the performance and accuracies needed are presented and characterizations of capillaries especially made for the BESSY soft x-ray microscope are shown. For the first time, we demonstrate that glass capillaries are well suited as condensers in the soft x-ray energy domain. Their focusing efficiency was measured to be 80% which is about an order of magnitude higher than the diffraction efficiency of zone plate based condensers.

Soft x-ray microscope using Fourier transform holography

International Nuclear Information System (INIS)

McNulty, I.; Kirz, J.; Jacobsen, C.; Anderson, E.; Howells, M.R.; Rarback, H.

1989-01-01

A Fourier transform holographic microscope with an anticipated resolution of better than 100 nm has been built. Extensive testing of the apparatus has begun. Preliminary results include the recording of interference fringes using 3.6 nm x-rays. The microscope employs a charge-coupled device (CCD) detector array of 576 x 384 elements. The system is illuminated by soft x-rays from a high brightness undulator. The reference point source is formed by a Fresnel zone plate with a finest outer zone width of 50 nm. Sufficient temporal coherence for hologram formation is obtained by a spherical grating monochromator. The x-ray hologram intensities at the recording plane are to be collected, digitized and reconstructed by computer. Data acquisition is under CAMAC control, while image display and off-line processing takes place on a VAX graphics workstation. Computational models of Fourier transform hologram synthesis, and reconstruction in the presence of noise, have demonstrated the feasibility of numerical methods in two dimensions, and that three-dimensional information is potentially recoverable. 13 refs., 3 figs

Energy dispersive X-ray analysis in the electron microscope

CERN Document Server

Bell, DC

2003-01-01

This book provides an in-depth description of x-ray microanalysis in the electron microscope. It is sufficiently detailed to ensure that novices will understand the nuances of high-quality EDX analysis. Includes information about hardware design as well as the physics of x-ray generation, absorption and detection, and most post-detection data processing. Details on electron optics and electron probe formation allow the novice to make sensible adjustments to the electron microscope in order to set up a system which optimises analysis. It also helps the reader determine which microanalytical me

Electronic zooming TV readout system for an x-ray microscope

International Nuclear Information System (INIS)

Kinoshita, K.; Matsumura, T.; Inagaki, Y.; Hirai, N.; Sugiyama, M.; Kihara, H.; Watanabe, N.; Shimanuki, Y.

1993-01-01

The electronic zooming TV readout system using the X-ray zooming tube has been developed for purposes of real-time readout of very high resolution X-ray image, e.g. the output image from an X-ray microscope. The system limiting resolution is 0.2∼0.3 μm and it is easy to operate in practical applications

Simulating and optimizing compound refractive lens-based X-ray microscopes

DEFF Research Database (Denmark)

Simons, Hugh; Ahl, Sonja Rosenlund; Poulsen, Henning Friis

2017-01-01

A comprehensive optical description of compound refractive lenses (CRLs) in condensing and full-field X-ray microscopy applications is presented. The formalism extends ray-transfer matrix analysis by accounting for X-ray attenuation by the lens material. Closed analytical expressions for critical......-lens limit. This limit may be satisfied by a range of CRL geometries, suggesting alternative approaches to improving the resolution and efficiency of CRLs and X-ray microscopes....

Development of X-ray photoelectron microscope with a compact X-ray source generated by line-focused laser irradiation

International Nuclear Information System (INIS)

Yamaguchi, N.; Takahashi, Z.; Nishimura, Y.; Watanabe, K.; Okamoto, Y.; Sakata, A.; Azuma, H.; Hara, T.

2005-01-01

A laboratory-sized X-ray photoelectron microscope was constructed using a compact X-ray source produced by line-focused laser irradiation. The system is a scanning type photoelectron microscope where X-ray beam is micro-focused via Schwarzschild optics. A compact laser-plasma X-ray source has been developed with a YAG laser, a line-focus lens assembly, an Al tape-target driver and a debris prevention system. The 13.1 nm X-ray was delivered along line plasma whose length was 0.6 or 11 mm with higher intensity than that from a point-focused source. The Schwarzschild optics having the designed demagnification of 224, which was coated with Mo/Si multilayers for 13.1 nm X-ray, was set on the beamline 1 m distant from the source. The electron energy analyser was a spherical capacitor analyser with the photoelectron image detection system that was suited for detection of vast photoelectrons excited by an X-ray pulse of ns-order duration. The spatial resolution less than 5 μm has been confirmed from the variation of As 3d electron intensity along the position of the GaAs sample coated with a photo-resist test pattern

Ultra-high resolution water window x ray microscope optics design and analysis

Science.gov (United States)

Shealy, David L.; Wang, C.

1993-01-01

This project has been focused on the design and analysis of an ultra-high resolution water window soft-x-ray microscope. These activities have been accomplished by completing two tasks contained in the statement of work of this contract. The new results from this work confirm: (1) that in order to achieve resolutions greater than three times the wavelength of the incident radiation, it will be necessary to use spherical mirror surfaces and to use graded multilayer coatings on the secondary in order to accommodate the large variations of the angle of incidence over the secondary when operating the microscope at numerical apertures of 0.35 or greater; (2) that surface contour errors will have a significant effect on the optical performance of the microscope and must be controlled to a peak-to-valley variation of 50-100 A and a frequency of 8 periods over the surface of a mirror; and (3) that tolerance analysis of the spherical Schwarzschild microscope has been shown that the water window operations will require 2-3 times tighter tolerances to achieve a similar performance of operations with 130 A radiation. These results have been included in a manuscript included in the appendix.

Soft X-ray imaging with axisymmetry microscope and electronic readout

International Nuclear Information System (INIS)

Sauneuf, A.; Cavailler, C.; Henry, Ph.; Launspach, J.; Mascureau, J. de; Rostaing, M.

1984-11-01

An axisymmetric microscope with 10 X magnification has been constructed; its resolution has been measured using severals grids, backlighted by an X-ray source and found to be near 25 μm. So it could be used to make images of laser driven plasmas in the soft X-ray region. In order to see rapidly those images we have associated it with a new detector. It is a small image converter tube with a soft X-ray photocathode and a P20 phosphor deposited on an optic fiber plate. The electronic image appearing on the screen is read by a CCD working in the spectral range. An electronic image readout chain, which is identical to those we use with streak cameras, then processes automatically and immediatly the images given by the microscope

A zone plate soft x-ray microscope using monochromatized undulator radiation at the beamline NE1B of the TRISTAN Accumulation Ring

International Nuclear Information System (INIS)

Wang, J.; Kagoshima, Y.; Miyahara, T.; Ando, M.; Aoki, S.; Anderson, E.; Attwood, D.; Kern, D.

1995-01-01

A soft x-ray microscope has been developed at the beamline NE1B of the 6.5-GeV TRISTAN Accumulation Ring (AR). It makes use of undulator radiation as its source and a zone plate with the outermost zone width of 50 nm as its imaging element. It has two main features. First, the undulator radiation is monochromatized by a grazing incidence grating monochromator to match to the monochromaticity requirement of the zone plate. Second, a visible light prefocus unit consisting of two objectives has been designed and installed in the x-ray microscope. The x-ray optical system of the microscope can be adjusted easily, quickly, and precisely by using this unit. The microscope can resolve 55-nm lines and spaces in a zone plate test pattern

X-ray analysis and mapping by wavelength dispersive X-ray spectroscopy in an electron microscope

International Nuclear Information System (INIS)

Tanaka, Miyoko; Takeguchi, Masaki; Furuya, Kazuo

2008-01-01

A compact and easy-to-use wavelength dispersive X-ray spectrometer using a multi-capillary X-ray lens attached to a scanning (transmission) electron microscope has been tested for thin-film analysis. B-K spectra from thin-film boron compounds (B 4 C, h-BN, and B 2 O 3 ) samples showed prominent peak shifts and detailed structural differences. Mapping images of a thin W/Si double-layer sample resolved each element clearly. Additionally, a thin SiO 2 film grown on a Si substrate was imaged with O-K X-rays. Energy and spatial resolution of the system is also discussed

Scanning Microscopes Using X Rays and Microchannels

Science.gov (United States)

Wang, Yu

2003-01-01

Scanning microscopes that would be based on microchannel filters and advanced electronic image sensors and that utilize x-ray illumination have been proposed. Because the finest resolution attainable in a microscope is determined by the wavelength of the illumination, the xray illumination in the proposed microscopes would make it possible, in principle, to achieve resolutions of the order of nanometers about a thousand times as fine as the resolution of a visible-light microscope. Heretofore, it has been necessary to use scanning electron microscopes to obtain such fine resolution. In comparison with scanning electron microscopes, the proposed microscopes would likely be smaller, less massive, and less expensive. Moreover, unlike in scanning electron microscopes, it would not be necessary to place specimens under vacuum. The proposed microscopes are closely related to the ones described in several prior NASA Tech Briefs articles; namely, Miniature Microscope Without Lenses (NPO-20218), NASA Tech Briefs, Vol. 22, No. 8 (August 1998), page 43; and Reflective Variants of Miniature Microscope Without Lenses (NPO-20610), NASA Tech Briefs, Vol. 26, No. 9 (September 2002) page 6a. In all of these microscopes, the basic principle of design and operation is the same: The focusing optics of a conventional visible-light microscope are replaced by a combination of a microchannel filter and a charge-coupled-device (CCD) image detector. A microchannel plate containing parallel, microscopic-cross-section holes much longer than they are wide is placed between a specimen and an image sensor, which is typically the CCD. The microchannel plate must be made of a material that absorbs the illuminating radiation reflected or scattered from the specimen. The microchannels must be positioned and dimensioned so that each one is registered with a pixel on the image sensor. Because most of the radiation incident on the microchannel walls becomes absorbed, the radiation that reaches the

Current status of the Scanning X-ray Microscope at the ESRF

International Nuclear Information System (INIS)

Barrett, Ray; Kaulich, Burkhard; Salome, Murielle; Susini, Jean

2000-01-01

A short description of the Scanning X-ray Microscope of the ESRF ID21 X-ray microscopy beamline is given and the consequences of the relatively wide operating energy range discussed. The current capabilities of the instrument are demonstrated through images and spectra recorded from a variety of pilot experiments, including X-ray fluorescence imaging, microdiffraction and XANES measurements

High resolution projection X-ray microscope equipped with fluorescent X-ray analyzer and its applications

International Nuclear Information System (INIS)

Minami, K; Saito, Y; Kai, H; Shirota, K; Yada, K

2009-01-01

We have newly developed an open type fine-focus X-ray tube 'TX-510' to realize a spatial resolution of 50nm and to radiate low energy characteristic X-rays for giving high absorption contrast to images of microscopic organisms. The 'TX-510' employs a ZrO/W(100) Schottky emitter and an 'In-Lens Field Emission Gun'. The key points of the improvements are (1) reduced spherical aberration coefficient of magnetic objective lens, (2) easy and accurate focusing, (3) newly designed astigmatism compensator, (4) segmented thin film target for interchanging the target materials by electron beam shift and (5) fluorescent X-ray analysis system.

Non-contact micro mass evaluation method using an X-ray microscope

Energy Technology Data Exchange (ETDEWEB)

Kim, Jiseok; Sun, Gwang Min; Baek, Ha Ni; Hoang, Sy Minh Tuan; Park, Sun Ae [Korea Atomic Energy Research Institute, Daejeon (Korea, Republic of)

2017-07-15

For the mass inspection of attached foils such as printed electrodes, mass should be measured by a non-contact method with the capacity to measure a small mass of micrograms. In this study, the masses of 1 mg to 10 mg electrodes were evaluated using an X-ray microscope. The results were compared with the masses determined by using a digital scale with a 0.005 mg error. The average of the relative error between the mass measurements using the X-ray microscope and those using the digital scale was less than 2.51%. The results show that X-ray mass evaluation method can be used for mass measurement of micro objects by replacing a digital scale.

X-ray photoelectron microscope with a compact x-ray source generated by line-focused laser irradiation

International Nuclear Information System (INIS)

Yamaguchi, N.; Okamoto, Y.; Hara, T.; Takahashi, Z.; Nishimura, Y.; Sakata, A.; Watanabe, K.; Azuma, H.

2004-01-01

Full text: A laboratory-sized microscopic system of x-ray photoelectrons has been developing using a compact x-ray source produced by line-focused laser irradiation. The system is a scanning type photoelectron microscope where x-ray beam is micro-focused via a Schwartzschild optics. A compact laser-plasma x-ray source has been developed with a YAG laser system, a line-focus lens system, a tape-target driving system and a debris prevention system, that was operated at repetition rate of 10 Hz or 50 Hz. X-rays were delivered along line plasma whose length was 0.6 to 11 mm with higher intensity than that from a point-focused source. Because the transition line of Al V (13.1 nm) was prominent in the soft x-ray spectrum when the Al tape target irradiated at the lower power density of 10 11 W/cm 2 , the 13.1 nm x-ray was used as an excitation source. The Schwartzschild optics was set on the beamline at a distance about 1 m from the source, which was coated with Mo/Si multilayers for 13.1 nm x-ray. The designed demagnification is 224 that was confirmed in the previous experiment. Therefore, an x-ray micro spot of sub-micron size can be formed on a sample surface when the source size is less than about 0.2 mm. Samples were set on a two-axis high-precision piezo stage mounted to a four-axis manipulator. The electron energy analyzer was a spherical capacitor analyzer with mean diameter of 279.4 mm. The electron detector was a microchannel plate (MCP) with a phosphor screen and the optical image of electrons on the exit plane of the analyzer was taken and recorded by using an ultra low dark noise CCD camera, that was suited for detection of vast photoelectrons excited by x-ray pulse of ns-order duration. We performed spatial resolution test measurements by using a GaAs wafer coated with photo-resist that formed a stripe pattern. The spatial resolution less than 3 micron has been obtained from the variation of As 3d electron intensity along the position of the GaAs sample

Characteristics of X-ray photons in tilted incident laser-produced plasma

International Nuclear Information System (INIS)

Wang Ruirong; Chen Weimin; Xie Dongzhu

2008-01-01

Characteristics of X-ray and spout direction of heat plasma flow were studied on Shenguang-II laser facility. Using of pinhole X-ray camera, X-ray photons from the plasma of aluminum (Al) irradiated by 1.053 μm laser, was measured and analysed. It is observed that the spatial distribution of X-ray photons in Al plasma for tilted irradiation is symmetic at the center of the target. The spout direction of heat plasma flow is inferred by the distribution contour of X-ray photons. the experimental results show that the spout direction of heat plasma flow is normal to target plane and the output intensity of X-ray photons does not increase significantly for tilted laser incidence. Uniformity of laser energy deposition is improved by superposing tilted incident and laser perpendicularly incident laser. At the same time, it is found that the conversion efficiency from the tilted incident laser energy to X-ray photons of laser-produced plasma is decreased. (authors)

Study of laser-imploded core plasmas with an advanced Kirkpatrick endash Baez x-ray microscope

International Nuclear Information System (INIS)

Kodama, R.; Shiraga, H.; Miyanaga, M.; Matsushita, T.; Nakai, M.; Azechi, H.; Mima, K.; Kato, Y.

1997-01-01

We developed an advanced Kirkpatrick endash Baez (AKB) x-ray microscope which consisted of two hyperbolic mirrors and two elliptic mirrors. The spatial resolution of approx-lt 3 μm was realized over ∼1 mm diam. This AKB microscope was used for x-ray imaging in laser fusion experiments. Laser absorption nonuniformity with a large wave number on a spherical solid target or a plane slab target was estimated by measurements of x-ray emission from the target surface with the microscope. The x-ray images of the imploded core plasmas were also obtained with the AKB microscope, changing the laser focus condition and the laser energy balance. copyright 1997 American Institute of Physics

Wolter type I x-ray focusing mirror using multilayer coatings

International Nuclear Information System (INIS)

Chon, Kwon Su; Namba, Yoshiharu; Yoon, Kwon-Ha

2006-01-01

A multilayer coating is a useful addition to a mirror in the x-ray region and has been applied to normal incidence mirrors used with soft x rays. When a multilayer coating is used on grazing incidence optics, higher performance can be achieved than without it.Cr/Sc multilayers coated on a Wolter type I mirror substrate for a soft x-ray microscope are considered. The reflectivity and effective solid angle are calculated for Wolter type I mirrors with uniform and laterally graded multilayer coatings. The laterally graded multilayer mirror showed superior x-ray performance, and the multilayer tolerances were relaxed. This multilayer mirror could be especially useful in the soft x-ray microscope intended for biological applications

Laboratory soft x-ray microscopy and tomography

International Nuclear Information System (INIS)

Bertilson, Michael

2011-01-01

Soft x-ray microscopy in the water-window (λ = 2.28 nm - 4.36 nm) is based on zone-plate optics and allows high-resolution imaging of, e.g., cells and soils in their natural or near-natural environment. Three-dimensional imaging is provided via tomographic techniques, soft x-ray cryo tomography. However, soft x-ray microscopes with such capabilities have been based on large-scale synchrotron x-ray facilities, thereby limiting their accessibility for a wider scientific community. This Thesis describes the development of the Stockholm laboratory soft x-ray microscope to three-dimensional cryo tomography and to new optics-based contrast mechanisms. The microscope relies on a methanol or nitrogen liquid-jet laser-plasma source, normal-incidence multilayer or zone-plate condenser optics, in-house fabricated zone-plate objectives, and allows operation at two wavelengths in the water-window, λ = 2.48 nm and λ = 2.48 nm. With the implementation of a new state-of-the-art normal-incidence multilayer condenser for operation at λ = 2.48 nm and a tiltable cryogenic sample stage the microscope now allows imaging of dry, wet or cryo-fixed samples. This arrangement was used for the first demonstration of laboratory soft x-ray cryo microscopy and tomography. The performance of the microscope has been demonstrated in a number of experiments described in this Thesis, including, tomographic imaging with a resolution of 140 nm, cryo microscopy and tomography of various cells and parasites, and for studies of aqueous soils and clays. The Thesis also describes the development and implementation of single-element differential-interference and Zernike phase-contrast zone-plate objectives. The enhanced contrast provided by these optics reduce exposure times or lowers the dose in samples and are of major importance for harder x-ray microscopy. The implementation of a high-resolution 50 nm compound zone-plate objective for sub-25-nm resolution imaging is also described. All experiments

Nanoscale X-Ray Microscopic Imaging of Mammalian Mineralized Tissue

OpenAIRE

Andrews, Joy C.; Almeida, Eduardo; van der Meulen, Marjolein C.H.; Alwood, Joshua S.; Lee, Chialing; Liu, Yijin; Chen, Jie; Meirer, Florian; Feser, Michael; Gelb, Jeff; Rudati, Juana; Tkachuk, Andrei; Yun, Wenbing; Pianetta, Piero

2010-01-01

A novel hard transmission X-ray microscope (TXM) at the Stanford Synchrotron Radiation Light-source operating from 5 to 15 keV X-ray energy with 14 to 30 µm2 field of view has been used for high-resolution (30–40 nm) imaging and density quantification of mineralized tissue. TXM is uniquely suited for imaging of internal cellular structures and networks in mammalian mineralized tissues using relatively thick (50 µm), untreated samples that preserve tissue micro- and nanostructure. To test this...

The 2-ID-B intermediate-energy scanning X-ray microscope at the APS

International Nuclear Information System (INIS)

McNulty, I.; Paterson, D.; Arko, J.; Erdmann, M.; Goetze, K.; Ilinski, P.; Mooney, T.; Vogt, S.; Xu, S.; Frigo, S.P.; Stampfl, A.P.J.; Wang, Y.

2002-01-01

The intermediate-energy scanning x-ray microscope at beamline 2-ID-B at the Advanced Photon Source is a dedicated instrument for materials and biological research. The microscope uses a zone plate lens to focus coherent 1-4 keV x-rays to a 60 nm focal spot of 10 9 photons/s onto the sample. It records simultaneous transmission and energy-resolved fluorescence images. We have used the microscope for nano-tomography of chips and micro-spectroscopy of cells. (authors)

X-Ray Optics at NASA Marshall Space Flight Center

Science.gov (United States)

O'Dell, Stephen L.; Atkins, Carolyn; Broadway, David M.; Elsner, Ronald F.; Gaskin, Jessica A.; Gubarev, Mikhail V.; Kilaru, Kiranmayee; Kolodziejczak, Jeffery J.; Ramsey, Brian D.; Roche, Jacqueline M.;

Development of hard X-ray dark-field microscope using full-field optics

International Nuclear Information System (INIS)

Takano, Hidekazu; Azuma, Hiroaki; Shimomura, Sho; Tsuji, Takuya; Tsusaka, Yoshiyuki; Kagoshima, Yasushi

2016-01-01

We develop a dark-field X-ray microscope using full-field optics based on a synchrotron beamline. Our setup consists of a condenser system and a microscope objective with an angular acceptance larger than that of the condenser. The condenser system is moved downstream from its regular position such that the focus of the condenser is behind the objective. The dark-field microscope optics are configured by excluding the converging beam from the condenser at the focal point. The image properties of the system are evaluated by observing and calculating a Siemens star test chart with 10 keV X-rays. Our setup allows easy switching to bright-field imaging. (author)

Direct observation of X-ray induced atomic motion using scanning tunneling microscope combined with synchrotron radiation.

Science.gov (United States)

Saito, Akira; Tanaka, Takehiro; Takagi, Yasumasa; Hosokawa, Hiromasa; Notsu, Hiroshi; Ohzeki, Gozo; Tanaka, Yoshihito; Kohmura, Yoshiki; Akai-Kasaya, Megumi; Ishikawa, Tetsuya; Kuwahara, Yuji; Kikuta, Seishi; Aono, Masakazu

2011-04-01

X-ray induced atomic motion on a Ge(111)-c(2 x 8) clean surface at room temperature was directly observed with atomic resolution using a synchrotron radiation (SR)-based scanning tunneling microscope (STM) system under ultra high vacuum condition. The atomic motion was visualized as a tracking image by developing a method to merge the STM images before and after X-ray irradiation. Using the tracking image, the atomic mobility was found to be strongly affected by defects on the surface, but was not dependent on the incident X-ray energy, although it was clearly dependent on the photon density. The atomic motion can be attributed to surface diffusion, which might not be due to core-excitation accompanied with electronic transition, but a thermal effect by X-ray irradiation. The crystal surface structure was possible to break even at a lower photon density than the conventionally known barrier. These results can alert X-ray studies in the near future about sample damage during measurements, while suggesting the possibility of new applications. Also the obtained results show a new availability of the in-situ SR-STM system.

Scanning transmission x-ray microscope for materials science spectromicroscopy at the ALS

Energy Technology Data Exchange (ETDEWEB)

Warwick, T.; Seal, S.; Shin, H. [Ernest Orlando Lawrence Berkeley National Lab., CA (United States)] [and others

1997-04-01

The brightness of the Advanced Light Source will be exploited by several new instruments for materials science spectromicroscopy over the next year or so. The first of these to become operational is a scanning transmission x-ray microscope with which near edge x-ray absorption spectra (NEXAFS) can be measured on spatial features of sub-micron size. Here the authors describe the instrument as it is presently implemented, its capabilities, some studies made to date and the developments to come. The Scanning Transmission X-ray Microscope makes use of a zone plate lens to produce a small x-ray spot with which to perform absorption spectroscopy through thin samples. The x-ray beam from ALS undulator beamline 7.0 emerges into the microscope vessel through a silicon nitride vacuum window 160nm thick and 300{mu}m square. The vessel is filled with helium at atmospheric pressure. The zone plate lens is illuminated 1mm downstream from the vacuum window and forms an image in first order of a pinhole which is 3m upstream in the beamline. An order sorting aperture passes the first order converging light and blocks the unfocused zero order. The sample is at the focus a few mm downstream of the zone plate and mounted from a scanning piezo stage which rasters in x and y so that an image is formed, pixel by pixel, by an intensity detector behind the sample. Absorption spectra are measured point-by-point as the photon energy is scanned by rotating the diffraction grating in the monochromator and changing the undulator gap.

Figure tolerance of a Wolter type I mirror for a soft-x-ray microscope

International Nuclear Information System (INIS)

Chon, Kwon Su; Namba, Yoshiharu; Yoon, Kwon-Ha

2007-01-01

The demand for an x-ray microscope has received much attention because of the desire to study living cells at a high resolution and in a hydrated environment. A Wolter type I mirror used for soft-x-ray microscope optics has many advantages. From the mirror fabrication point of view, it is necessary to perform tolerance analysis, particularly with respect to figure errors that considerably degrade the image quality.The figure tolerance of a Wolter type I mirror for a biological application in terms of the image quality and the state-of-the-art fabrication technology is discussed. The figure errors rapidly destroyed the image quality, and the required slope error depended on the detector used in the soft-x-ray microscope

Soft x-ray spectro microscope

International Nuclear Information System (INIS)

Campuzano, J.C.; Jennings, G.; Beaulaigue, L.; Rodricks, B.G.; Brizard, C.

1990-01-01

This paper reports on the development of an x-ray photoelectron microscope that provides spatial as well as chemical information on the nature of the sample. Photons from the Aladdin Synchrotron at the Synchrotron Radiation Center in Stoughton, WI are monochromatized by an extended-range Grasshopper monochromator covering the range 40 to 1500 eV with energy resolution varying between 10 and 200 MeV. The monochromatized radiation generates photoelectrons in the sample, which are energy-analyzed with a resolving power E|ΔE > 5 x 10 4 and imaged by a multichannel plate array. The visible image is transferred to a computer by a virtual-phase charge-coupled device camera with a dynamic range of 4096:1. Preliminary coarse measurements indicate a spatial resolution of the instrument of better than 1μm, although a limit of 600 Angstrom is possible. The instrument provides chemical shift-resolved images of low-lying core levels in a variety of samples

Development of Scanning-Imaging X-Ray Microscope for Quantitative Three-Dimensional Phase Contrast Microimaging

International Nuclear Information System (INIS)

Takeuchi, Akihisa; Suzuki, Yoshio; Uesugi, Kentaro

2013-01-01

A novel x-ray microscope system has been developed for the purpose of quantitative and sensitive three-dimensional (3D) phase-contrast x-ray microimaging. The optical system is a hybrid that consists of a scanning microscope optics with a one-dimensional (1D) focusing (line-focusing) device and an imaging microscope optics with a 1D objective. These two optics are orthogonally arranged regarding their common optical axis. Each is used for forming each dimension of two-dimensional (2D) image. The same data acquisition process as that of the scanning microscope system enables quantitative and sensitive x-ray imaging such as phase contrast and absorption contrast. Because a 2D image is measured with only 1D translation scan, much shorter measurement time than that of conventional scanning optics has been realized. By combining a computed tomography (CT) technique, some 3D CT application examples are demonstrated

Non-scanning x-ray fluorescence microscope: application to real time micro-imaging

International Nuclear Information System (INIS)

Sakurai, K.; Eba, H.

2000-01-01

So far, x-ray fluorescence (XRF) micro-imaging has been performed by a 2D positional scan of a sample against a collimated beam. Obtaining information on specific elements in a nondestructive manner is an attractive prospect for many scientific applications. Furthermore, a synchrotron micro-beam can enhance the spatial resolution down to 0.1 μm. However, the total measuring time becomes quite long (a few hours to a half day), since one needs a number of scanning points in order to obtain a high-quality image. It is possible to obtain an x-ray image with 1 M pixels and with 20 μm resolution in a very short time of 20 sec - 3 min using a non-scanning XRF microscope, which is based on completely different concept. In the present report, we discuss the application of this technique to real time micro-imaging. The experiments were carried out at BL-4A, Photon Factory, Tsukuba, Japan. We employed a grazing-incidence arrangement to make primary x-rays illuminate the whole sample surface. We adopted parallel-beam optics and extremely-close-geometry in order to detect x-ray fluorescence with a CCD camera. The selective-excitation capability of tunable monochromatic synchrotron radiation is a feasible method for distinguishing the elements of interest. One can obtain an image of each element by differentiating the images obtained above and below the absorption edges of interest. The growth of metallic dendrites from a solution dropped on a substrate was studied successfully. Several different growth patterns, corresponding to concentration and other conditions for diffusion, were observed as x-ray images. Since the present technique requires only 40 sec for each shot, it is possible to record a growing process through repeated exposures like a movie. The authors would like to thank Prof. A. Iida (Photon Factory) for his valuable comments. (author)

Sensitivity Analysis of X-ray Spectra from Scanning Electron Microscopes

Energy Technology Data Exchange (ETDEWEB)

Miller, Thomas Martin [Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Patton, Bruce W. [Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Weber, Charles F. [Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Bekar, Kursat B. [Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

2014-10-01

The primary goal of this project is to evaluate x-ray spectra generated within a scanning electron microscope (SEM) to determine elemental composition of small samples. This will be accomplished by performing Monte Carlo simulations of the electron and photon interactions in the sample and in the x-ray detector. The elemental inventories will be determined by an inverse process that progressively reduces the difference between the measured and simulated x-ray spectra by iteratively adjusting composition and geometric variables in the computational model. The intended benefit of this work will be to develop a method to perform quantitative analysis on substandard samples (heterogeneous phases, rough surfaces, small sizes, etc.) without involving standard elemental samples or empirical matrix corrections (i.e., true standardless quantitative analysis).

The design and test of ellipsoidal glass capillaries as condensers for X-ray microscope

International Nuclear Information System (INIS)

Tian Jinping; Li Wenjie; Chen Jie; Liu Gang; Xiong Ying; Liu Longhua; Huang Xinlong; Tian Yangchao

2008-01-01

A high resolution X-ray microscope endstation was constructed on a wiggler beamline at the National Synchrotron Radiation Laboratory (NSRL). Parameters of the ellipsoidal glass capillaries as condensers were calculated and designed based on the illumination requests in the X-ray microscope system. Performance of the ellipsoidal glass capillaries was tested. The results indicate that the beam size agrees with the designed parameters and focus efficiencies of the ellipsoidal glass capillary condensers are better than 85%. (authors)

Microscopic analysis on showers recorded as single core on X-ray films

International Nuclear Information System (INIS)

Amato, N.M.; Arata, N.; Maldonado, R.H.C.

1983-01-01

Cosmic-ray particles recorded as single dark spots on X-ray films with use of the emulsion chamber data of Brazil-Japan Collaboration are studied. Some results of microscopic analysis of such single-core-like showers on nuclear emulsion plates are reported. (Author) [pt

Hartmann characterization of the PEEM-3 aberration-corrected X-ray photoemission electron microscope.

Science.gov (United States)

Scholl, A; Marcus, M A; Doran, A; Nasiatka, J R; Young, A T; MacDowell, A A; Streubel, R; Kent, N; Feng, J; Wan, W; Padmore, H A

2018-05-01

Aberration correction by an electron mirror dramatically improves the spatial resolution and transmission of photoemission electron microscopes. We will review the performance of the recently installed aberration corrector of the X-ray Photoemission Electron Microscope PEEM-3 and show a large improvement in the efficiency of the electron optics. Hartmann testing is introduced as a quantitative method to measure the geometrical aberrations of a cathode lens electron microscope. We find that aberration correction leads to an order of magnitude reduction of the spherical aberrations, suggesting that a spatial resolution of below 100 nm is possible at 100% transmission of the optics when using x-rays. We demonstrate this improved performance by imaging test patterns employing element and magnetic contrast. Published by Elsevier B.V.

Present status of research and development on X-ray microprobe

International Nuclear Information System (INIS)

Koike, Masaki; Suzuki, I.H.

1991-01-01

X-ray beam micro-analysis has advanced rapidly in these years in conjunction with the development of powerful X-ray sources. Among a variety of methods being attempted, the method using a collimated narrow beam has been important because of high brightness, and of usability in both regions of soft and hard X-rays. In the soft X-ray region, the focused beam is formed by a fresnel zone plate or a Schwaltzschild mirror assembly, and can be used for scanning transmission microscope or scanning photoelectron microscope. In the hard X-ray region, the beam is formed by grazing incidence mirrors, and can be used for X-ray fluorescence micro-analysis for obtaining elemental mapping. In this report, the recent progress on the soft X-ray scanning microscopy and the X-ray microprobe has been surveyed, together with the improvement on the related optical elements. (author) 84 refs

Grazing Incidence X-ray Scattering and Diffraction

Indian Academy of Sciences (India)

IAS Admin

several materials as a function of angle of incidence, αi with X-rays of wavelength ..... are several advantages of using this formulation for the description of surface ..... print of the surface (as shown at the botton of Figure. 5). A Soller collimator ...

Observations of a human hair shaft with an x-ray microscope

Energy Technology Data Exchange (ETDEWEB)

Youn, Hwa Shik [Pohang Accelerator Laboratory, Pohang University of Science and Technology, 31 San, Hyoja-dong, Pohang, KyungBuk, 790-784 (Korea, Republic of); Jung, Suk-Won [Nano Mechatronics Research Center, Korea Electronics Technology Institute, 455-6 Masan-ri, Jinwi-myon, Pyungtaek, Kyungki-do, 451-865 (Korea, Republic of)

2005-11-21

We observed the internal structures of a human hair shaft using x-ray microscopes with a spatial resolution in the range from a few microns to less than 100 nm. The energy of the x-ray used is 6.95 keV. The Zernike phase contrast together with a spatial resolution better than 100 nm enabled us to see the cuticles of scales, the cortex of macrofibrils and the medulla. All these internal features and more can easily be observed with no sample preparation including staining.

Observations of a human hair shaft with an x-ray microscope

International Nuclear Information System (INIS)

Youn, Hwa Shik; Jung, Suk-Won

2005-01-01

We observed the internal structures of a human hair shaft using x-ray microscopes with a spatial resolution in the range from a few microns to less than 100 nm. The energy of the x-ray used is 6.95 keV. The Zernike phase contrast together with a spatial resolution better than 100 nm enabled us to see the cuticles of scales, the cortex of macrofibrils and the medulla. All these internal features and more can easily be observed with no sample preparation including staining

Use of an axisymmetric microscope with electronic readout for collecting soft X-ray images

International Nuclear Information System (INIS)

Cavailler, C.; Henry, P.; Launspach, J.; De Mascureau, J.; Millerioux, M.; Rostaing, M.; Sauneuf, R.

1984-08-01

The axisymmetric microscope, first discussed by Wolter, provides high resolution and sensitivity for investigating the soft X-ray emission of laser-driven plasmas. Such a device having a 10 X magnification has been constructed. We present a comparison between the images of laser-driven plasmas given by this microscope and by a 10 X pinhole camera. Until now these images were recorded on X-ray film. We have shown that film could be replaced by C.C.D. in a pinhole camera when the photon energy lies within the 1-10 keV range. Below 1 keV the quantum yield is too low so we have used an image converter tube made by RTC. It is a diode-inverter tube with a soft X-ray photocathode and a P20 phosphor deposited on an optic fiber plate. The electronic image appearing on the screen is read by a C.C.D. working in the visible spectral fields. An electronic image readout chain, which is identical to those associated with streak cameras, then processes automatically and immediately the images given by the microscope [fr

Revisiting Bragg's X-ray microscope: Scatter based optical transient grating detection of pulsed ionising radiation

International Nuclear Information System (INIS)

Fullagar, Wilfred K.; Paganin, David M.; Hall, Chris J.

2011-01-01

Transient optical gratings for detecting ultrafast signals are routine for temporally resolved photochemical investigations. Many processes can contribute to the formation of such gratings; we indicate use of optically scattering centres that can be formed with highly variable latencies in different materials and devices using ionising radiation. Coherent light scattered by these centres can form the short-wavelength-to-optical-wavelength, incoherent-to-coherent basis of a Bragg X-ray microscope, with inherent scope for optical phasing. Depending on the dynamics of the medium chosen, the way is open to both ultrafast pulsed and integrating measurements. For experiments employing brief pulses, we discuss high-dynamic-range short-wavelength diffraction measurements with real-time optical reconstructions. Applications to optical real-time X-ray phase-retrieval are considered. -- Research highlights: → It is timely that the concept of Bragg's X-ray microscope be revisited. → Transient gratings can be used for X-ray all-optical information processing. → Applications to optical real-time X-ray phase-retrieval are considered.

Image enhancement of x-ray microscope using frequency spectrum analysis

International Nuclear Information System (INIS)

Li Wenjie; Chen Jie; Tian Jinping; Zhang Xiaobo; Liu Gang; Tian Yangchao; Liu Yijin; Wu Ziyu

2009-01-01

We demonstrate a new method for x-ray microscope image enhancement using frequency spectrum analysis. Fine sample characteristics are well enhanced with homogeneous visibility and better contrast from single image. This method is easy to implement and really helps to improve the quality of image taken by our imaging system.

Image enhancement of x-ray microscope using frequency spectrum analysis

Energy Technology Data Exchange (ETDEWEB)

Li Wenjie; Chen Jie; Tian Jinping; Zhang Xiaobo; Liu Gang; Tian Yangchao [National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, Anhui 230029 (China); Liu Yijin; Wu Ziyu, E-mail: wuzy@ihep.ac.c, E-mail: ychtian@ustc.edu.c [Institute of High Energy Physics, Chinese Academy of Science, Beijing 100049 (China)

2009-09-01

We demonstrate a new method for x-ray microscope image enhancement using frequency spectrum analysis. Fine sample characteristics are well enhanced with homogeneous visibility and better contrast from single image. This method is easy to implement and really helps to improve the quality of image taken by our imaging system.

An X-ray grazing incidence phase multilayer grating

CERN Document Server

Chernov, V A; Mytnichenko, S V

2001-01-01

An X-ray grazing incidence phase multilayer grating, representing a thin grating placed on a multilayer mirror, is proposed. A high efficiency of grating diffraction can be obtained by the possibility of changing the phase shift of the wave diffracted from the multilayer under the Bragg and total external reflection conditions. A grazing incidence phase multilayer grating consisting of Pt grating stripes on a Ni/C multilayer and optimized for the hard X-ray range was fabricated. Its diffraction properties were studied at photon energies of 7 and 8 keV. The obtained maximum value of the diffraction efficiency of the +1 grating order was 9% at 7 keV and 6.5% at 8 keV. The data obtained are in a rather good accordance with the theory.

Optimization of an analytical electron microscope for x-ray microanalysis: instrumental problems

International Nuclear Information System (INIS)

Bentley, J.; Zaluzec, N.J.; Kenik, E.A.; Carpenter, R.W.

1979-01-01

The addition of an energy dispersive x-ray spectrometer to a modern transmission or scanning transmission electron microscope can provide a powerful tool in the characterization of the materials. Unfortunately this seemingly simple modification can lead to a host of instrumental problems with respect to the accuracy, validity, and quality of the recorded information. This tutorial reviews the complications which can arise in performing x-ray microanalysis in current analytical electron microscopes. The first topic treated in depth is fluorescence by uncollimated radiation. The source, distinguishing characteristics, effects on quantitative analysis and schemes for elimination or minimization as applicable to TEM/STEMs, D-STEMs and HVEMs are discussed. The local specimen environment is considered in the second major section where again detrimental effects on quantitative analysis and remedial procedures, particularly the use of low-background specimen holers, are highlighted. Finally, the detrimental aspects of specimen contamination, insofar as they affect x-ray microanalysis, are discussed. It is concluded that if the described preventive measures are implemented, reliable quantitative analysis is possible

Local detection of X-ray spectroscopies with an in-situ Atomic Force Microscope

International Nuclear Information System (INIS)

Rodrigues, M S; Dhez, O; Denmat, S Le; Felici, R; Comin, F; Chevrier, J

2008-01-01

The in situ combination of Scanning Probe Microscopies with X-ray microbeams adds a variety of new possibilities to the panoply of synchrotron radiation techniques. This paper describes an optics-free Atomic Force Microscope that can be directly installed on most of the synchrotron radiation end-stations for combined X-ray and atomic force microscopy experiments. The instrument can be used for atomic force imaging of the investigated sample or to locally measure the X-ray absorption or diffraction, or it can also be used to mechanically interact with the sample while simultaneously taking spectroscopy or diffraction measurements. The local character of these measurements is intrinsically linked with the use of the Atomic Force Microscope tip. It is the sharp tip that gives the opportunity to measure the photons flux impinging on it, or to locally measure the absorption coefficient or the shape of the diffraction pattern. At the end an estimation of the limits of the various techniques presented is also discussed.

3-d chemical imaging using angle-scan nanotomography in a soft X-ray scanning transmission X-ray microscope

Energy Technology Data Exchange (ETDEWEB)

Hitchcock, A.P.; Johansson, G.A. [McMaster, BIMR, Hamilton (Canada); Mitchell, G.E. [Dow Chemical, Analytical Science, Midland, MI (United States); Keefe, M.H. [Dow Chemical, Dow Latex, Midland, MI (United States); Tyliszcak, T. [LBNL, Advanced Light Source, Berkeley, CA (United States)

2008-08-15

Three-dimensional chemical mapping using angle scan nanotomography in a soft X-ray scanning transmission X-ray microscope (STXM) has been used to investigate the spatial distributions of a low density polyacrylate polyelectrolyte ionomer inside submicron sized polystyrene microspheres. Acquisition of tomograms at multiple photon energies provides true, quantifiable 3-d chemical sensitivity. Both pre-O 1s and C 1s results are shown. The study reveals aspects of the 3-d distribution of the polyelectrolyte that were inferred indirectly or had not been known prior to this study. The potential and challenges for extension of the technique to studies of other polymeric and to biological systems is discussed. (orig.)

Cryotomography x-ray microscopy state

Science.gov (United States)

Le Gros, Mark; Larabell, Carolyn A.

2010-10-26

An x-ray microscope stage enables alignment of a sample about a rotation axis to enable three dimensional tomographic imaging of the sample using an x-ray microscope. A heat exchanger assembly provides cooled gas to a sample during x-ray microscopic imaging.

Laboratory characterization of Woelter x-ray optics

International Nuclear Information System (INIS)

Remington, B.A.; Morales, R.I.

1994-04-01

We have conducted an extensive series of characterization measurements of a Woe1ter incidence x-ray microscope. The measurements were carried out on 5% sectors of the Woe1ter x-ray optic in a laboratory utilizing a high brightness, ''point'' x-ray source and fall into two categories. (1) Absolute reflectance measurements as a function of x-ray energy were made with Si(Li) detectors to acquire continuum spectra prior to and after reflecting off the Woe1ter optic. (2) Spatial resolution measurements were made using back-illuminated pinholes or grids imaged onto film or an x-ray CCD camera. The depth of field was mapped out by varying the distance between the Woe1ter optic and the backlit grid

The Marshall Grazing Incidence X-ray Spectrometer

Science.gov (United States)

Kobayashi, Ken; Winebarger, Amy R.; Savage, Sabrina; Champey, Patrick; Cheimets, Peter N.; Hertz, Edward; Bruccoleri, Alexander R.; Golub, Leon; Ramsey, Brian; Ranganathan, Jaganathan; Marquez, Vanessa; Allured, Ryan; Parker, Theodore; Heilmann, Ralf K.; Schattenburg, Mark L.

2017-08-01

The Marshall Grazing Incidence X-ray Spectrometer (MaGIXS) is a NASA sounding rocket instrument designed to obtain spatially resolved soft X-ray spectra of the solar atmosphere in the 6-24 Å (0.5-2.0 keV) range. The instrument consists of a single shell Wolter Type-I telescope, a slit, and a spectrometer comprising a matched pair of grazing incidence parabolic mirrors and a planar varied-line space diffraction grating. The instrument is designed to achieve a 50 mÅ spectral resolution and 5 arcsecond spatial resolution along a +/-4-arcminute long slit, and launch is planned for 2019. We report on the status and our approaches for fabrication and alignment for this novel optical system. The telescope and spectrometer mirrors are replicated nickel shells, and are currently being fabricated at the NASA Marshall Space Flight Center. The diffraction grating is currently under development by the Massachusetts Institute of Technology (MIT); because of the strong line spacing variation across the grating, it will be fabricated through e-beam lithography.

A framed, 16-image Kirkpatrick-Baez x-ray microscope

Science.gov (United States)

Marshall, F. J.; Bahr, R. E.; Goncharov, V. N.; Glebov, V. Yu.; Peng, B.; Regan, S. P.; Sangster, T. C.; Stoeckl, C.

2017-09-01

A 16-image Kirkpatrick-Baez (KB)-type x-ray microscope consisting of compact KB mirrors [F. J. Marshall, Rev. Sci. Instrum. 83, 10E518 (2012)] has been assembled for the first time with mirrors aligned to allow it to be coupled to a high-speed framing camera. The high-speed framing camera has four independently gated strips whose emission sampling interval is ˜30 ps. Images are arranged four to a strip with ˜60-ps temporal spacing between frames on a strip. By spacing the timing of the strips, a frame spacing of ˜15 ps is achieved. A framed resolution of ˜6-μm is achieved with this combination in a 400-μm region of laser-plasma x-ray emission in the 2- to 8-keV energy range. A principal use of the microscope is to measure the evolution of the implosion stagnation region of cryogenic DT target implosions on the University of Rochester's OMEGA Laser System [T. R. Boehly et al., Opt. Commun. 133, 495 (1997)]. The unprecedented time and spatial resolutions achieved with this framed, multi-image KB microscope have made it possible to accurately determine the cryogenic implosion core emission size and shape at the peak of stagnation. These core size measurements, taken in combination with those of ion temperature, neutron-production temporal width, and neutron yield allow for inference of core pressures, currently exceeding 50 Gbar in OMEGA cryogenic target implosions [Regan et al., Phys. Rev. Lett. 117, 025001 (2016)].

A compact soft X-ray microscope using an electrode-less Z-pinch source

Science.gov (United States)

Horne, S. F.; Silterra, J.; Holber, W.

2009-09-01

Soft X-rays (medical interest both for imaging and microdosimetry applications. X-ray sources at this low energy present a technological challenge. Synchrotrons, while very powerful and flexible, are enormously expensive national research facilities. Conventional X-ray sources based on electron bombardment can be compact and inexpensive, but low x-ray production efficiencies at low electron energies restrict this approach to very low power applications. Laser-based sources tend to be expensive and unreliable. Energetiq Technology, Inc. (Woburn, MA, USA) markets a 92 eV, 10W(2pi sr) electrode-less Z-pinch source developed for advanced semiconductor lithography. A modified version of this commercial product has produced 400 mW at 430 eV (2pi sr), appropriate for water window soft X-ray microscopy. The US NIH has funded Energetiq to design and construct a demonstration microscope using this source, coupled to a condenser optic, as the illumination system. The design of the condenser optic matches the unique characteristics of the source to the illumination requirements of the microscope, which is otherwise a conventional design. A separate program is underway to develop a microbeam system, in conjunction with the RARAF facility at Columbia University, NY, USA. The objective is to develop a focused, sub-micron beam capable of delivering > 1 Gy/second to the nucleus of a living cell. While most facilities of this type are coupled to a large and expensive particle accelerator, the Z-pinch X-ray source enables a compact, stand-alone design suitable to a small laboratory. The major technical issues in this system involve development of suitable focusing X-ray optics. Current status of these programs will be reported. (Supported by NIH grants 5R44RR022488-03 and 5R44RR023753-03)

X-ray fluorescence analysis of thin films at glancing-incident and -takeoff angles

International Nuclear Information System (INIS)

Tsuji, K.; Sato, S.; Hirokawa, K.

1995-01-01

We have developed a new analytical method, Glancing-Incidence and -Takeoff X-Ray Fluorescence (GIT-XRF) method for the first time. Here, we present an idea for a thin-film analysis and a surface analysis by the GIT-XRF method. In this method, the dependence of the fluorescent x-ray intensity on takeoff angle is measured at various incident angles of the primary x-ray. Compared with a total reflection x-ray fluorescence method, the GIT-XRF method allows a detailed thin-film analysis, because the thin film is cross-checked by many experimental curves. Moreover, a surface-sensitive analysis is also possible by the GIT-XRF method. (author)

Improving x-ray fluorescence signal for benchtop polychromatic cone-beam x-ray fluorescence computed tomography by incident x-ray spectrum optimization: a Monte Carlo study.

Science.gov (United States)

Manohar, Nivedh; Jones, Bernard L; Cho, Sang Hyun

2014-10-01

To develop an accurate and comprehensive Monte Carlo (MC) model of an experimental benchtop polychromatic cone-beam x-ray fluorescence computed tomography (XFCT) setup and apply this MC model to optimize incident x-ray spectrum for improving production/detection of x-ray fluorescence photons from gold nanoparticles (GNPs). A detailed MC model, based on an experimental XFCT system, was created using the Monte Carlo N-Particle (MCNP) transport code. The model was validated by comparing MC results including x-ray fluorescence (XRF) and scatter photon spectra with measured data obtained under identical conditions using 105 kVp cone-beam x-rays filtered by either 1 mm of lead (Pb) or 0.9 mm of tin (Sn). After validation, the model was used to investigate the effects of additional filtration of the incident beam with Pb and Sn. Supplementary incident x-ray spectra, representing heavier filtration (Pb: 2 and 3 mm; Sn: 1, 2, and 3 mm) were computationally generated and used with the model to obtain XRF/scatter spectra. Quasimonochromatic incident x-ray spectra (81, 85, 90, 95, and 100 keV with 10 keV full width at half maximum) were also investigated to determine the ideal energy for distinguishing gold XRF signal from the scatter background. Fluorescence signal-to-dose ratio (FSDR) and fluorescence-normalized scan time (FNST) were used as metrics to assess results. Calculated XRF/scatter spectra for 1-mm Pb and 0.9-mm Sn filters matched (r ≥ 0.996) experimental measurements. Calculated spectra representing additional filtration for both filter materials showed that the spectral hardening improved the FSDR at the expense of requiring a much longer FNST. In general, using Sn instead of Pb, at a given filter thickness, allowed an increase of up to 20% in FSDR, more prominent gold XRF peaks, and up to an order of magnitude decrease in FNST. Simulations using quasimonochromatic spectra suggested that increasing source x-ray energy, in the investigated range of 81-100 ke

Synchrotron-based X-ray microscopic studies for bioeffects of nanomaterials.

Science.gov (United States)

Zhu, Ying; Cai, Xiaoqing; Li, Jiang; Zhong, Zengtao; Huang, Qing; Fan, Chunhai

2014-04-01

There have been increasing interests in studying biological effects of nanomaterials, which are nevertheless faced up with many challenges due to the nanoscale dimensions and unique chemical properties of nanomaterials. Synchrotron-based X-ray microscopy, an advanced imaging technology with high spatial resolution and excellent elemental specificity, provides a new platform for studying interactions between nanomaterials and living systems. In this article, we review the recent progress of X-ray microscopic studies on bioeffects of nanomaterials in several living systems including cells, model organisms, animals and plants. We aim to provide an overview of the state of the art, and the advantages of using synchrotron-based X-ray microscopy for characterizing in vitro and in vivo behaviors and biodistribution of nanomaterials. We also expect that the use of a combination of new synchrotron techniques should offer unprecedented opportunities for better understanding complex interactions at the nano-biological interface and accounting for unique bioeffects of nanomaterials. Synchrotron-based X-ray microscopy is a non-destructive imaging technique that enables high resolution spatial mapping of metals with elemental level detection methods. This review summarizes the current use and perspectives of this novel technique in studying the biology and tissue interactions of nanomaterials. Copyright © 2014 Elsevier Inc. All rights reserved.

Hard X-ray phase-contrast microscope for observing transparent specimens

Energy Technology Data Exchange (ETDEWEB)

Kagoshima, Y.; Yokoyama, Y.; Niimi, T.; Koyama, T.; Tsusaka, Y.; Matsui, J. [Himeji Institute of Technology, Graduate School of Science, Hyogo (Japan); Takai, K. [Japan synchrotron Radiation Research Institute, Mikazuki, Hyogo (Japan)

2002-08-01

A hard X-ray transmission imaging microscope has been in use at the beamline BL24XU of Spring-8. It makes use of a phase zone plate made of tantalum as its X-ray lens, and is capable of imaging the structure as fine as 125-nm line-and-space pattern. The Zernike's phase-contrast method has been implemented to the microscope with phase plates made of gold. The photon energy was tuned to 12 keV just above the L{sub 3} absorption edge of gold (11.9 keV) in order to increase the image contrast. Polystyrene micro particles as transparent specimens were imaged clearly in the opposite image contrast with phase plates to shift the phase of the central order spectra in the back focal plane of the objective by one-quarter and three-quarters of a period, while the absorption contrast image showed little image contrast. Performance of the newly developed phase zone plate has been tested and it was confirmed that the structure as fine as 60-mm line-and-space pattern was able to be imaged. (authors)

The Development of a Scanning Soft X-Ray Microscope.

Science.gov (United States)

Rarback, Harvey Miles

We have developed a scanning soft X-ray microscope, which can be used to image natural biological specimens at high resolution and with less damage than electron microscopy. The microscope focuses a monochromatic beam of synchrotron radiation to a nearly diffraction limited spot with the aid of a high resolution Fresnel zone plate, specially fabricated for us at the IBM Watson Research Center. The specimen at one atmosphere is mechanically scanned through the spot and the transmitted radiation is efficiently detected with a flow proportional counter. A computer forms a realtime transmission image of the specimen which is displayed on a color monitor. Our first generation optics have produced images of natural wet specimens at a resolution of 300 nm.

The influence of the oblique incident X-ray that affected the image quality of the X-ray CCD sensor

International Nuclear Information System (INIS)

Suzuki, Yosuke; Matsumoto, Nobue; Morita, Hiroshi; Ohkawa, Hiromitsu

1998-01-01

The influence of the oblique incident X-ray that affected the image quality of the X-ray CCD sensor was examined and its correction was investigated. CDR was adopted in this study and evaluated image quality, by measuring MTF. The oblique projection was clinically permissible to about an oblique incident angle of 40 degrees although it exerts an influence on the magnifying power and density. The estimation of the oblique entrance direction and oblique incident angle was possible, by developing an oblique incident correction marker. When an oblique incident angle of θ degrees was measured, a correction is possible, by compressing the image cos (θ) times perpendicular to the rotational axis of CCD sensor. There was small decline of MTF, in the image where a correction for the influence of oblique incidence was made. By observation of the digital subtracted picture of the image after correction of oblique projection and that of normal, the resemblance in the two images indicated that this correction method was reasonable. (author)

Development of a scanning transmission x-ray microscope for the beamline P04 at PETRA III DESY

International Nuclear Information System (INIS)

Andrianov, Konstantin; Ewald, Johannes; Nisius, Thomas; Wilhein, Thomas; Lühl, Lars; Malzer, Wolfgang; Kanngießer, Birgit

2016-01-01

We present a scanning transmission x-ray microscope (STXM) built on top of our existing modular platform for high resolution imaging experiments. This platform consists of up to three separate vacuum chambers and custom designed piezo stages. These piezo stages are able to move precisely in x-, y- and z-direction, this makes it possible to adjust the components for different imaging modes. During recent experiments the endstation was operated mainly as a transmission x-ray microscope (TXM) [1, 2

High resolution hard x-ray microscope on a second generation synchrotron source

International Nuclear Information System (INIS)

Tian Yangchao; Li Wenjie; Chen Jie; Liu Longhua; Liu Gang; Tian Jinping; Xiong Ying; Tkachuk, Andrei; Gelb, Jeff; Hsu, George; Yun Wenbing

2008-01-01

A full-field, transmission x-ray microscope (TXM) operating in the energy range of 7-11 keV has been installed at the U7A beamline at the National Synchrotron Radiation Laboratory, a second generation synchrotron source operating at 0.8 GeV. Although the photon flux at sample position in the operating energy range is significantly low due to its relatively large emittance, the TXM can get high quality x-ray images with a spatial resolution down to 50 nm with acceptable exposure time. This TXM operates in either absorption or Zernike phase contrast mode with similar resolution. This TXM is a powerful analytical tool for a wide range of scientific areas, especially studies on nanoscale phenomena and structural imaging in biology, materials science, and environmental science. We present here the property of the x-ray source, beamline design, and the operation and key optical components of the x-ray TXM. Plans to improve the throughput of the TXM will be discussed.

Development of glancing-incidence and glancing-take-off X-ray fluorescence apparatus for surface and thin-film analyses

International Nuclear Information System (INIS)

Tsuji, Kouichi; Wagatsuma, Kazuaki; Yamada, Takashi; Utaka, Tadashi

1997-01-01

We have studied X-ray fluorescence analysis under glancing incidence and glancing take-off conditions. Recently, we have developed a third apparatus for detecting glancing-incidence and take-off X-ray fluorescence, which makes it possible to measure the incident-angle dependence, the take-off-angle dependence. X-ray reflectivity, and X-ray diffraction. Primarily, we have measured the take-off angular dependence of X-ray fluorescence using this apparatus. Glancing take-off X-ray fluorescence has some advantages in comparison with glancing-incidence X-ray fluorescence. The surface density and the absolute angles were determined by analysing the take-off angle dependence of the fluorescent X-rays emitted from identical atoms with the aid of the reciprocity theorem. (Author)

A three-dimensional X-ray diffraction microscope for deformation studies of polycrystals

DEFF Research Database (Denmark)

Fæster Nielsen, Søren; Lauridsen, E.M.; Juul Jensen, D.

2001-01-01

-dimensional X-ray diffraction (3DXRD) microscope installed at the European Synchrotron Radiation Facility in Grenoble provides a fast and non-destructive technique for mapping the embedded grains within thick samples in three dimensions. All essential features like the position, volume, orientation, stress...

Effect of surface roughness on takeoff-angle-dependent X-ray fluorescence of ultrathin films at glancing incidence

International Nuclear Information System (INIS)

Tsuji, Kouichi; Hirokawa, Kichinosuke; Sasaki, Atsushi.

1994-01-01

We had previously shown that takeoff-angle-dependent X-ray fluorescence (TAD-XRF) at glancing incidence is a useful method for the characterization of thin films. Here we report the effect of surface roughness of the substrate on TAD-XRF of an ultrathin film at a glancing incidence. An optically flat glass, scratched glasses and plano-convex lenses were used as substrates. A large-range contour such as warp and a roughness of microscopic scale affect the TAD-XRF profile. Therefore, to characterize the ultrathin film by the TAD-XRF method, the material whose roughness is being investigated should be used as the substrate in TAD-XRF measurement. (author)

High-Performance X-ray Detection in a New Analytical Electron Microscope

Science.gov (United States)

Lyman, C. E.; Goldstein, J. I.; Williams, D. B.; Ackland, D. W.; vonHarrach, S.; Nicholls, A. W.; Statham, P. J.

1994-01-01

X-ray detection by energy-dispersive spectrometry in the analytical electron microscope (AEM) is often limited by low collected X-ray intensity (P), modest peak-to-background (P/B) ratios, and limitations on total counting time (tau) due to specimen drift and contamination. A new AFM has been designed with maximization of P. P/B, and tau as the primary considerations. Maximization of P has been accomplished by employing a field-emission electron gun, X-ray detectors with high collection angles, high-speed beam blanking to allow only one photon into the detector at a time, and simultaneous collection from two detectors. P/B has been maximized by reducing extraneous background signals generated at the specimen holder, the polepieces and the detector collimator. The maximum practical tau has been increased by reducing specimen contamination and employing electronic drift correction. Performance improvments have been measured using the NIST standard Cr thin film. The 0-3 steradian solid angle of X-ray collection is the highest value available. The beam blanking scheme for X-ray detection provides 3-4 times greater throughput of X-rays at high count rates into a recorded spectrum than normal systems employing pulse-pileup rejection circuits. Simultaneous X-ray collection from two detectors allows the highest X-ray intensity yet recorded to be collected from the NIST Cr thin film. The measured P/B of 6300 is the highest level recorded for an AEM. In addition to collected X-ray intensity (cps/nA) and P/B measured on the standard Cr film, the product of these can be used as a figure-of-merit to evaluate instruments. Estimated minimum mass fraction (MMF) for Cr measured on the standard NIST Cr thin film is also proposed as a figure-of-merit for comparing X-ray detection in AEMs. Determinations here of the MMF of Cr detectable show at least a threefold improvement over previous instruments.

X-ray holographic microscopy using the atomic-force microscope

International Nuclear Information System (INIS)

Howells, M.R.; Jacobsen, C.J.; Lindaas, S.

1993-09-01

The present authors have been seeking for some time to improve the resolution of holographic microscopy and have engaged in a continuing series of experiments using the X1A soft x-ray undulator beam line at Brookhaven. The principle strategy for pushing the resolution lower in these experiments has been the use of polymer resists as x-ray detectors and the primary goal has been to develop the technique to become useful for examining wet biological material. In the present paper the authors report on progress in the use of resist for high-spatial-resolution x-ray detection. This is the key step in in-line holography and the one which sets the ultimate limit to the image resolution. The actual recording has always been quite easy, given a high-brightness undulator source, but the difficult step was the readout of the recorded pattern. The authors describe in what follows how they have built a special instrument: an atomic force microscope (AFM) to read holograms recorded in resist. They report the technical reasons for building, rather than buying, such an instrument and they give details of the design and performance of the device. The authors also describe the first attempts to use the system for real holography and the authors show results of both recorded holograms and the corresponding reconstructed images. Finally, the authors try to analyze the effect that these advances are likely to have on the future prospects for success in applications of x-ray holography and the degree to which the other technical systems that are needed for such success are available or within reach

Trace Element Mapping of a Biological Specimen by a Full-Field X-ray Fluorescence Imaging Microscope with a Wolter Mirror

International Nuclear Information System (INIS)

Hoshino, Masato; Yamada, Norimitsu; Ishino, Toyoaki; Namiki, Takashi; Watanabe, Norio; Aoki, Sadao

2007-01-01

A full-field X-ray fluorescence imaging microscope with a Wolter mirror was applied to the element mapping of alfalfa seeds. The X-ray fluorescence microscope was built at the Photon Factory BL3C2 (KEK). X-ray fluorescence images of several growing stages of the alfalfa seeds were obtained. X-ray fluorescence energy spectra were measured with either a solid state detector or a CCD photon counting method. The element distributions of iron and zinc which were included in the seeds were obtained using a photon counting method

Image alignment for tomography reconstruction from synchrotron X-ray microscopic images.

Directory of Open Access Journals (Sweden)

Chang-Chieh Cheng

Full Text Available A synchrotron X-ray microscope is a powerful imaging apparatus for taking high-resolution and high-contrast X-ray images of nanoscale objects. A sufficient number of X-ray projection images from different angles is required for constructing 3D volume images of an object. Because a synchrotron light source is immobile, a rotational object holder is required for tomography. At a resolution of 10 nm per pixel, the vibration of the holder caused by rotating the object cannot be disregarded if tomographic images are to be reconstructed accurately. This paper presents a computer method to compensate for the vibration of the rotational holder by aligning neighboring X-ray images. This alignment process involves two steps. The first step is to match the "projected feature points" in the sequence of images. The matched projected feature points in the x-θ plane should form a set of sine-shaped loci. The second step is to fit the loci to a set of sine waves to compute the parameters required for alignment. The experimental results show that the proposed method outperforms two previously proposed methods, Xradia and SPIDER. The developed software system can be downloaded from the URL, http://www.cs.nctu.edu.tw/~chengchc/SCTA or http://goo.gl/s4AMx.

Image alignment for tomography reconstruction from synchrotron X-ray microscopic images.

Science.gov (United States)

Cheng, Chang-Chieh; Chien, Chia-Chi; Chen, Hsiang-Hsin; Hwu, Yeukuang; Ching, Yu-Tai

2014-01-01

A synchrotron X-ray microscope is a powerful imaging apparatus for taking high-resolution and high-contrast X-ray images of nanoscale objects. A sufficient number of X-ray projection images from different angles is required for constructing 3D volume images of an object. Because a synchrotron light source is immobile, a rotational object holder is required for tomography. At a resolution of 10 nm per pixel, the vibration of the holder caused by rotating the object cannot be disregarded if tomographic images are to be reconstructed accurately. This paper presents a computer method to compensate for the vibration of the rotational holder by aligning neighboring X-ray images. This alignment process involves two steps. The first step is to match the "projected feature points" in the sequence of images. The matched projected feature points in the x-θ plane should form a set of sine-shaped loci. The second step is to fit the loci to a set of sine waves to compute the parameters required for alignment. The experimental results show that the proposed method outperforms two previously proposed methods, Xradia and SPIDER. The developed software system can be downloaded from the URL, http://www.cs.nctu.edu.tw/~chengchc/SCTA or http://goo.gl/s4AMx.

Advanced laser-backlit grazing-incidence x-ray imaging systems for inertial confinement fusion research. II. Tolerance analysis

International Nuclear Information System (INIS)

Bennett, Guy R.; Folta, James A.

2001-01-01

Two example ultrahigh-spatial resolution laser-backlit grazing-incidence x-ray microscope designs for inertial confinement fusion (ICF) research have been described [Appl. Opt. 40, 4570 (2001)]. Here details of fabrication, assembly, and optical surface errors that are characteristic of present state-of-the-art superpolished multilayer-coated spherical mirrors are given. They indicate that good image qualities can be expected; in particular, <0.5-μm spatial resolution at very high x-ray energies (up to 25 keV) appears to be feasible. Existing ICF imaging diagnostics approach ∼2 μm spatial at low (<2 keV) energy. The improvement in resolution compared with that of other grazing-incidence devices is attributed to a fortuitous residual on-axis aberration dependence on short wavelengths; recent advances in mirror fabrication, including a new thin-film deposition technique to correct figure errors precisely in one dimension; and novel design. For even higher resolution, a means of creating precise aspherical mirrors of spheric-quality microroughness may be possible by use of the same deposition technique

Trends in environmental science using microscopic X-ray fluorescence

International Nuclear Information System (INIS)

Fittschen, Ursula Elisabeth Adriane; Falkenberg, Gerald

2011-01-01

Microscopic X-ray fluorescence (micro-XRF) is a versatile tool in environmental analysis. We review work done in this field from 2008 to 2010 and highlight new aspects. Overall, there is a strong trend to combine fluorescence data with other data like diffraction or absorption spectroscopy. Also, the use of laboratory based instrumentation has become wide spread as more commercial instruments are available. At laboratories and synchrotron sites the trend towards higher spatial resolution is still persistent hitting sub micrometer values in case of synchrotron set ups.

Trends in environmental science using microscopic X-ray fluorescence

Energy Technology Data Exchange (ETDEWEB)

Fittschen, Ursula Elisabeth Adriane, E-mail: ursula.fittschen@chemie.uni-hamburg.de [Department of Chemistry, University of Hamburg, Martin-Luther-King-Platz 6, 20146 Hamburg (Germany); Falkenberg, Gerald [Deutsches Elektronen-Synchrotron, Notkestr. 85, 22603 Hamburg (Germany)

2011-08-15

Microscopic X-ray fluorescence (micro-XRF) is a versatile tool in environmental analysis. We review work done in this field from 2008 to 2010 and highlight new aspects. Overall, there is a strong trend to combine fluorescence data with other data like diffraction or absorption spectroscopy. Also, the use of laboratory based instrumentation has become wide spread as more commercial instruments are available. At laboratories and synchrotron sites the trend towards higher spatial resolution is still persistent hitting sub micrometer values in case of synchrotron set ups.

Electron microscopic studies on experimental skin cancer after combination treatment with X-ray, hematoporphyrin oligomer and caffeine

International Nuclear Information System (INIS)

Ueda, Keiichi; Ishiguro, Kazumori; Takaishi, Kimiko; Hatcho, Masahiro; Nakagawa, Shigemori

1992-01-01

The effect of combination treatment with X-ray, hematoporphyrin oligomer (HpO) and caffeine (Caf) was compared electron microscopically with that of a single use of these treatments. In experimental skin cancer, ultrastructural changes of nuclei and cytoplasm of tumor cells after combination treatment with HpO, X-ray and Caf showed more remarkable changes than in single X-ray irradiation and in HpO and X-ray irradiation. It is concluded that the combination treatment of HpO, X-ray and Caf is useful to the skin cancers in clinical practice. (author)

Electron microscopic studies on experimental skin cancer after combination treatment with X-ray, hematoporphyrin oligomer and caffeine

Energy Technology Data Exchange (ETDEWEB)

Ueda, Keiichi; Ishiguro, Kazumori; Takaishi, Kimiko; Hatcho, Masahiro; Nakagawa, Shigemori (Fukui Medical School, Matsuoka (Japan))

1992-05-01

The effect of combination treatment with X-ray, hematoporphyrin oligomer (HpO) and caffeine (Caf) was compared electron microscopically with that of a single use of these treatments. In experimental skin cancer, ultrastructural changes of nuclei and cytoplasm of tumor cells after combination treatment with HpO, X-ray and Caf showed more remarkable changes than in single X-ray irradiation and in HpO and X-ray irradiation. It is concluded that the combination treatment of HpO, X-ray and Caf is useful to the skin cancers in clinical practice. (author).

Custom AFM for X-ray beamlines: in situ biological investigations under physiological conditions

Energy Technology Data Exchange (ETDEWEB)

Gumí-Audenis, B. [ESRF, The European Synchrotron, Grenoble (France); Institute for Bioengineering of Catalonia (IBEC), Barcelona (Spain); Physical Chemistry Department, Universitat de Barcelona, Barcelona (Spain); Networking Biomedical Research Center on Bioengineering, Biomaterials and Nanomedicine (CIBER-BBN), Madrid (Spain); Carlà, F. [ESRF, The European Synchrotron, Grenoble (France); Vitorino, M. V. [University of Lisboa, Falculty of Science, Biosystems and Integrative Sciences Institute - BIOISI, Lisbon (Portugal); Panzarella, A. [ESRF, The European Synchrotron, Grenoble (France); Porcar, L. [Institut Laue-Langevin, Grenoble (France); Boilot, M. [ORTEC, Marseille (France); Guerber, S. [CEA, LETI Grenoble (France); Bernard, P. [ESRF, The European Synchrotron, Grenoble (France); Rodrigues, M. S. [University of Lisboa, Falculty of Science, Biosystems and Integrative Sciences Institute - BIOISI, Lisbon (Portugal); Sanz, F.; Giannotti, M. I. [Institute for Bioengineering of Catalonia (IBEC), Barcelona (Spain); Physical Chemistry Department, Universitat de Barcelona, Barcelona (Spain); Networking Biomedical Research Center on Bioengineering, Biomaterials and Nanomedicine (CIBER-BBN), Madrid (Spain); Costa, L., E-mail: luca.costa@esrf.fr [ESRF, The European Synchrotron, Grenoble (France)

2015-09-30

The performance of a custom atomic force microscope for grazing-incidence X-ray experiments on hydrated soft and biological samples is presented. A fast atomic force microscope (AFM) has been developed that can be installed as a sample holder for grazing-incidence X-ray experiments at solid/gas or solid/liquid interfaces. It allows a wide range of possible investigations, including soft and biological samples under physiological conditions (hydrated specimens). The structural information obtained using the X-rays is combined with the data gathered with the AFM (morphology and mechanical properties), providing a unique characterization of the specimen and its dynamics in situ during an experiment. In this work, lipid monolayers and bilayers in air or liquid environment have been investigated by means of AFM, both with imaging and force spectroscopy, and X-ray reflectivity. In addition, this combination allows the radiation damage induced by the beam on the sample to be studied, as has been observed on DOPC and DPPC supported lipid bilayers under physiological conditions.

Combined optic system based on polycapillary X-ray optics and single-bounce monocapillary optics for focusing X-rays from a conventional laboratory X-ray source

Energy Technology Data Exchange (ETDEWEB)

Sun, Xuepeng; Liu, Zhiguo [The Key Laboratory of Beam Technology and Materials Modification of the Ministry of Education, Beijing Normal University, Beijing 100875 (China); College of Nuclear Science and Technology, Beijing Normal University, Beijing 100875 (China); Beijing Radiation Center, Beijing 100875 (China); Sun, Tianxi, E-mail: stx@bnu.edu.cn [The Key Laboratory of Beam Technology and Materials Modification of the Ministry of Education, Beijing Normal University, Beijing 100875 (China); College of Nuclear Science and Technology, Beijing Normal University, Beijing 100875 (China); Beijing Radiation Center, Beijing 100875 (China); Yi, Longtao; Sun, Weiyuan; Li, Fangzuo; Jiang, Bowen [The Key Laboratory of Beam Technology and Materials Modification of the Ministry of Education, Beijing Normal University, Beijing 100875 (China); College of Nuclear Science and Technology, Beijing Normal University, Beijing 100875 (China); Beijing Radiation Center, Beijing 100875 (China); Ma, Yongzhong [Center for Disease Control and Prevention of Beijing, Beijing 100013 (China); Ding, Xunliang [The Key Laboratory of Beam Technology and Materials Modification of the Ministry of Education, Beijing Normal University, Beijing 100875 (China); College of Nuclear Science and Technology, Beijing Normal University, Beijing 100875 (China); Beijing Radiation Center, Beijing 100875 (China)

2015-12-01

Two combined optic systems based on polycapillary X-ray optics and single-bounce monocapillary optics (SBMO) were designed for focusing the X-rays from a conventional laboratory X-ray source. One was based on a polycapillary focusing X-ray lens (PFXRL) and a single-bounce ellipsoidal capillary (SBEC), in which the output focal spot with the size of tens of micrometers of the PFXRL was used as the “virtual” X-ray source for the SBEC. The other system was based on a polycapillary parallel X-ray lens (PPXRL) and a single-bounce parabolic capillary (SBPC), in which the PPXRL transformed the divergent X-ray beam from an X-ray source into a quasi-parallel X-ray beam with the divergence of sever milliradians as the incident illumination of the SBPC. The experiment results showed that the combined optic systems based on PFXRL and SBEC with a Mo rotating anode X-ray generator with the focal spot with a diameter of 300 μm could obtain a focal spot with the total gain of 14,300 and focal spot size of 37.4 μm, and the combined optic systems based on PPXRL and SBPC with the same X-ray source mentioned above could acquire a focal spot with the total gain of 580 and focal spot size of 58.3 μm, respectively. The two combined optic systems have potential applications in micro X-ray diffraction, micro X-ray fluorescence, micro X-ray absorption near edge structure, full field X-ray microscopes and so on.

A full-field transmission x-ray microscope for time-resolved imaging of magnetic nanostructures

Energy Technology Data Exchange (ETDEWEB)

Ewald, J.; Nisius, T.; Abbati, G.; Baumbach, S.; Overbuschmann, J.; Wilhein, T. [Institute for X-Optics (IXO), Hochschule Koblenz, Joseph-Rovan-Allee 2, 53424 Remagen (Germany); Wessels, P.; Wieland, M.; Drescher, M. [The Hamburg Centre for Ultrafast Imaging (CUI), University of Hamburg, Luruper Chaussee 149, 22761 Hamburg (Germany); Institut für Experimentalphysik, University of Hamburg, Luruper Chaussee 149, 22761 Hamburg (Germany); Vogel, A. [Institut für Angewandte Physik, University of Hamburg, Jungiusstraße 11, 20355 Hamburg (Germany); Viefhaus, J. [Deutsches Elektronen-Synchrotron (DESY), Notkestraße 85, 22607 Hamburg (Germany); Meier, G. [The Hamburg Centre for Ultrafast Imaging (CUI), University of Hamburg, Luruper Chaussee 149, 22761 Hamburg (Germany); Max Planck Institute for the Structure and Dynamics of Matter, Luruper Chaussee 149, 22761 Hamburg (Germany)

2016-01-28

Sub-nanosecond magnetization dynamics of small permalloy (Ni{sub 80}Fe{sub 20}) elements has been investigated with a new full-field transmission microscope at the soft X-ray beamline P04 of the high brilliance synchrotron radiation source PETRA III. The soft X-ray microscope generates a flat-top illumination field of 20 μm diameter using a grating condenser. A tilted nanostructured magnetic sample can be excited by a picosecond electric current pulse via a coplanar waveguide. The transmitted light of the sample plane is directly imaged by a micro zone plate with < 65 nm resolution onto a 2D gateable X-ray detector to select one particular bunch in the storage ring that probes the time evolution of the dynamic information successively via XMCD spectromicroscopy in a pump-probe scheme. In the experiments it was possible to generate a homogeneously magnetized state in patterned magnetic layers by a strong magnetic Oersted field pulse of 200 ps duration and directly observe the recovery to the initial flux-closure vortex patterns.

High Resolution Higher Energy X-ray Microscope for Mesoscopic Materials

International Nuclear Information System (INIS)

Snigireva, I; Snigirev, A

2013-01-01

We developed a novel X-ray microscopy technique to study mesoscopically structured materials, employing compound refractive lenses. The easily seen advantage of lens-based methodology is the possibility to retrieve high resolution diffraction pattern and real-space images in the same experimental setup. Methodologically the proposed approach is similar to the studies of crystals by high resolution transmission electron microscopy. The proposed microscope was applied for studying of mesoscopic materials such as natural and synthetic opals, inverted photonic crystals

The XM-1 high resolution x-ray microscope at the ALS

International Nuclear Information System (INIS)

Meyer-Ilse, W.; Johnson, L.E.; Bates, W.; Lucero, A.; Anderson, E.H.; Denbeaux, G.

2000-01-01

The XM-1 x-ray microscope was built to obtain a high throughput of high-resolution transmission images with a wide variety of thick (< 10 micron) samples. Modeled after a 'conventional' full-field microscope, the XM-1 makes use of zone plates (ZP) for the condenser and objective elements. We present an overview of the recent activities at XM-1. Over the past year many enhancements have taken place such as the use of more efficient zone plates and the development of a cryogenic sample stage. Moreover, we have been developing the spectromicroscopy capabilities of the microscope to distinguish different element and chemical states within a sample while obtaining high spatial resolution images. We report on these and other advances. Additionally, the microscope has been actively used in many fields including biology, environmental and material science. Some of these recent achievements will be highlighted as well

Characterization of calcium crystals in Abelia using x-ray diffraction and electron microscopes

Science.gov (United States)

Localization, chemical composition, and morphology of calcium crystals in leaves and stems of Abelia mosanensis and A. ×grandiflora were analyzed with a variable pressure scanning electron microscope (VP-SEM) equipped with an X-ray diffraction system, low temperature SEM (LT-SEM) and a transmission ...

High resolution x-ray microscope

OpenAIRE

Gary, C. K.; Park, H.; Lombardo, L. W.; Piestrup, M. A.; Cremer, J. T.; Pantell, R. H.; Dudchik, Y. I.

2007-01-01

The authors present x-ray images of grid meshes and biological material obtained using a microspot x-ray tube with a multilayer optic and a 92-element parabolic compound refractive lens CRL made of a plastic containing only hydrogen and carbon. Images obtained using this apparatus are compared with those using an area source with a spherical lens and a spherical lens with multilayer condenser. The authors found the best image quality using the multilayer condenser with a parabolic lens, com...

Characterization of X-UV multilayers by grazing incidence X-ray reflectometry

International Nuclear Information System (INIS)

Nevot, L.; Pardo, B.; Corno, J.

1988-01-01

The performance of multilayers at the X-UV wavelengths depends upon the structural and geometrical imperfections of the deposited materials. These two respective contributions are not easily separated when only one Bragg peak is recorded, as is usually the case in the X-UV range, so a prediction of the performance at other wavelengths appears rather doubtful. We show how grazing incidence X-ray reflectometry (using Cu Kα 1 radiation) allows the precise evaluation of both interfacial roughnesses and thickness errors, as well as their variations through the stacks. As examples, we analyse three (W/C) multilayers with periods between 3 to 6 nm and up to 40 layers

Design of grazing-incidence multilayer supermirrors for hard-X-ray reflectors

DEFF Research Database (Denmark)

Joensen, K. D.; Voutov, P.; Szentgyorgyi, A.

1995-01-01

Extremely broadband grazing-incidence multilayers for hard-X-ray reflection can be obtained by a gradual change of the layer thicknesses down through the structure. Existing approaches for designing similar neutron optics, called supermirrors, are shown to provide respectable performance when...... applied to X-ray multilayers. However, none of these approaches consider the effects of imperfect layer interfaces and absorption in the overlying layers. Adaptations of neutron designs that take these effects into account are presented, and a thorough analysis of two specific applications (a single hard......-X-ray reflector and a hard-X-ray telescope) shows that an improved performance can be obtained. A multilayer whose bilayer thicknesses are given by a power law expression is found to provide the best solution; however, it is only slightly better than some of the adapted neutron designs...

Analytical electron microscope based on scanning transmission electron microscope with wavelength dispersive x-ray spectroscopy to realize highly sensitive elemental imaging especially for light elements

International Nuclear Information System (INIS)

Koguchi, Masanari; Tsuneta, Ruriko; Anan, Yoshihiro; Nakamae, Koji

2017-01-01

An analytical electron microscope based on the scanning transmission electron microscope with wavelength dispersive x-ray spectroscopy (STEM-WDX) to realize highly sensitive elemental imaging especially for light elements has been developed. In this study, a large-solid-angle multi-capillary x-rays lens with a focal length of 5 mm, long-time data acquisition (e.g. longer than 26 h), and a drift-free system made it possible to visualize boron-dopant images in a Si substrate at a detection limit of 0.2 atomic percent. (paper)

Phase zone plates as condensers for the Gottingen scanning x-ray microscope

International Nuclear Information System (INIS)

Hilkenbach, R.; Thieme

1987-01-01

With the Gottingen scanning x-ray microscope the synchrotron source is image by x-ray optics into a monochromatic small scan spot, through which a specimen can be moved. Hereby one part of the optics, the condenser zone plate and a pinhole, works as a linear monochromator in the wavelength region of λ = 2.36 nm to λ = 4.5 nm. The efficiency of such a condenser should be as high as possible to minimize the loss of radiation. Phase zone plates have a four times higher efficiency in the first order of diffraction than amplitude zone plates. Two condenser zone plates, KZP4 and KZP5, have been constructed so that they are well suited for the use in the scanning microscope. These zone plates have been made holographically by superposing two wavefronts of laser light in an specific designed optical arrangement and exposing the zone plate structure into a photoresist. Using reactive ion etching (RIE) the structure has been transformed into Germanium. The thickness of the zone plate has been chosen to show at λ = 2.36 nm a phase effect. The efficiency has been measured at the Berliner Elektronenspeircherring Gesellschaft fur Synchrotronstrahlung m.b.H., Berlin

Adaptive grazing incidence optics for the next generation of x-ray observatories

Science.gov (United States)

Lillie, C.; Pearson, D.; Plinta, A.; Metro, B.; Lintz, E.; Shropshire, D.; Danner, R.

2010-09-01

Advances in X-ray astronomy require high spatial resolution and large collecting area. Unfortunately, X-ray telescopes with grazing incidence mirrors require hundreds of concentric mirror pairs to obtain the necessary collecting area, and these mirrors must be thin shells packed tightly together... They must also be light enough to be placed in orbit with existing launch vehicles, and able to be fabricated by the thousands for an affordable cost. The current state of the art in X-ray observatories is represented by NASA's Chandra X-ray observatory with 0.5 arc-second resolution, but only 400 cm2 of collecting area, and by ESA's XMM-Newton observatory with 4,300 cm2 of collecting area but only 15 arc-second resolution. The joint NASA/ESA/JAXA International X-ray Observatory (IXO), with {15,000 cm2 of collecting area and 5 arc-second resolution which is currently in the early study phase, is pushing the limits of passive mirror technology. The Generation-X mission is one of the Advanced Strategic Mission Concepts that NASA is considering for development in the post-2020 period. As currently conceived, Gen-X would be a follow-on to IXO with a collecting area >= 50 m2, a 60-m focal length and 0.1 arc-second spatial resolution. Gen-X would be launched in {2030 with a heavy lift Launch Vehicle to an L2 orbit. Active figure control will be necessary to meet the challenging requirements of the Gen-X optics. In this paper we present our adaptive grazing incidence mirror design and the results from laboratory tests of a prototype mirror.

Partially coherent X-ray wavefront propagation simulations including grazing-incidence focusing optics.

Science.gov (United States)

Canestrari, Niccolo; Chubar, Oleg; Reininger, Ruben

2014-09-01

X-ray beamlines in modern synchrotron radiation sources make extensive use of grazing-incidence reflective optics, in particular Kirkpatrick-Baez elliptical mirror systems. These systems can focus the incoming X-rays down to nanometer-scale spot sizes while maintaining relatively large acceptance apertures and high flux in the focused radiation spots. In low-emittance storage rings and in free-electron lasers such systems are used with partially or even nearly fully coherent X-ray beams and often target diffraction-limited resolution. Therefore, their accurate simulation and modeling has to be performed within the framework of wave optics. Here the implementation and benchmarking of a wave-optics method for the simulation of grazing-incidence mirrors based on the local stationary-phase approximation or, in other words, the local propagation of the radiation electric field along geometrical rays, is described. The proposed method is CPU-efficient and fully compatible with the numerical methods of Fourier optics. It has been implemented in the Synchrotron Radiation Workshop (SRW) computer code and extensively tested against the geometrical ray-tracing code SHADOW. The test simulations have been performed for cases without and with diffraction at mirror apertures, including cases where the grazing-incidence mirrors can be hardly approximated by ideal lenses. Good agreement between the SRW and SHADOW simulation results is observed in the cases without diffraction. The differences between the simulation results obtained by the two codes in diffraction-dominated cases for illumination with fully or partially coherent radiation are analyzed and interpreted. The application of the new method for the simulation of wavefront propagation through a high-resolution X-ray microspectroscopy beamline at the National Synchrotron Light Source II (Brookhaven National Laboratory, USA) is demonstrated.

Metrology and Alignment of Light Weight Grazing Incidence X-Ray Mirrors

Science.gov (United States)

Zhang, William; Content, David; Petre, Robert; Saha, Timo

2000-01-01

Metrology and alignment of light weight X-ray optics have been a challenge for two reasons: (1) that the intrinsic mirror quality and distortions caused by handling can not be easily separated, and (2) the diffraction limits of the visible light become a severe problem at the order of one arc-minute. Traditional methods of using a normal incident pencil or small parallel beam which monitors a tiny fraction of the mirror in question at a given time can not adequately monitor those distortions. We are developing a normal incidence setup that monitors a large fraction, if not the whole, of the mirror at any given time. It will allow us to align thin X-ray mirrors to-an accuracy of a few arc seconds or to a limit dominated by the mirror intrinsic quality.

Small scale soft x-ray lasers

International Nuclear Information System (INIS)

Skinner, C.H.; DiCicco, D.S.; Kim, D.; Voorhees, D.; Suckewer, S.

1990-01-01

The widespread application of soft x-ray laser technology is contingent on the development of small scale soft x-ray lasers that do not require large laser facilities. Progress in the development of soft x-ray lasers pumped by a Nd laser of energy 6-12J is reported below. Application of an existing soft x-ray laser to x-ray microscopy has begun. A soft x-ray laser of output energy 1-3 mJ at 18,2 nm has been used to record high resolution images of biological specimens. The contact images were recorded on photoresist which was later viewed in a scanning electron microscope. The authors present a composite optical x-ray laser microscope design

Oblique incidence effects in direct x-ray detectors: A first-order approximation using a physics-based analytical model

International Nuclear Information System (INIS)

Badano, Aldo; Freed, Melanie; Fang Yuan

2011-01-01

Purpose: The authors describe the modifications to a previously developed analytical model of indirect CsI:Tl-based detector response required for studying oblique x-ray incidence effects in direct semiconductor-based detectors. This first-order approximation analysis allows the authors to describe the associated degradation in resolution in direct detectors and compare the predictions to the published data for indirect detectors. Methods: The proposed model is based on a physics-based analytical description developed by Freed et al. [''A fast, angle-dependent, analytical model of CsI detector response for optimization of 3D x-ray breast imaging systems,'' Med. Phys. 37(6), 2593-2605 (2010)] that describes detector response functions for indirect detectors and oblique incident x rays. The model, modified in this work to address direct detector response, describes the dependence of the response with x-ray energy, thickness of the transducer layer, and the depth-dependent blur and collection efficiency. Results: The authors report the detector response functions for indirect and direct detector models for typical thicknesses utilized in clinical systems for full-field digital mammography (150 μm for indirect CsI:Tl and 200 μm for a-Se direct detectors). The results suggest that the oblique incidence effect in a semiconductor detector differs from that in indirect detectors in two ways: The direct detector model produces a sharper overall PRF compared to the response corresponding to the indirect detector model for normal x-ray incidence and a larger relative increase in blur along the x-ray incidence direction compared to that found in indirect detectors with respect to the response at normal incidence angles. Conclusions: Compared to the effect seen in indirect detectors, the direct detector model exhibits a sharper response at normal x-ray incidence and a larger relative increase in blur along the x-ray incidence direction with respect to the blur in the

X-ray imaging with compound refractive lens and microfocus X-ray tube

OpenAIRE

Pina, Ladislav; Dudchik, Yury; Jelinek, Vaclav; Sveda, Libor; Marsik, Jiri; Horvath, Martin; Petr, Ondrej

2008-01-01

Compound refractive lenses (CRL), consisting of a lot number in-line concave microlenses made of low-Z material were studied. Lenses with focal length 109 mm and 41 mm for 8-keV X-rays, microfocus X-ray tube and X-ray CCD camera were used in experiments. Obtained images show intensity distribution of magnified microfocus X-ray source focal spot. Within the experiments, one lens was also used as an objective lens of the X-ray microscope, where the copper anode X-ray microfocus tube served as a...

Differential Deposition for Surface Figure Corrections in Grazing Incidence X-Ray Optics

Science.gov (United States)

Ramsey, Brian D.; Kilaru, Kiranmayee; Atkins, Carolyn; Gubarev, Mikhail V.; Broadway, David M.

2015-01-01

Differential deposition corrects the low- and mid- spatial-frequency deviations in the axial figure of Wolter-type grazing incidence X-ray optics. Figure deviations is one of the major contributors to the achievable angular resolution. Minimizing figure errors can significantly improve the imaging quality of X-ray optics. Material of varying thickness is selectively deposited, using DC magnetron sputtering, along the length of optic to minimize figure deviations. Custom vacuum chambers are built that can incorporate full-shell and segmented Xray optics. Metrology data of preliminary corrections on a single meridian of full-shell x-ray optics show an improvement of mid-spatial frequencies from 6.7 to 1.8 arc secs HPD. Efforts are in progress to correct a full-shell and segmented optics and to verify angular-resolution improvement with X-ray testing.

Development of quantitative x-ray microtomography

International Nuclear Information System (INIS)

Deckman, H.W.; Dunsmuir, J.A.; D'Amico, K.L.; Ferguson, S.R.; Flannery, B.P.

1990-01-01

The authors have developed several x-ray microtomography systems which function as quantitative three dimensional x-ray microscopes. In this paper the authors describe the evolutionary path followed from making the first high resolution experimental microscopes to later generations which can be routinely used for investigating materials. Developing the instrumentation for reliable quantitative x-ray microscopy using synchrotron and laboratory based x-ray sources has led to other imaging modalities for obtaining temporal and spatial two dimensional information

First set of gated x-ray imaging diagnostics for the Laser Megajoule facility

Energy Technology Data Exchange (ETDEWEB)

Rosch, R.; Trosseille, C.; Caillaud, T.; Allouche, V.; Bourgade, J. L.; Briat, M.; Brunel, P.; Burillo, M.; Casner, A.; Depierreux, S.; Gontier, D.; Jadaud, J. P.; Le Breton, J. P.; Llavador, P.; Loupias, B.; Miquel, J. L.; Oudot, G.; Perez, S.; Raimbourg, J.; Rousseau, A. [CEA-DAM Ile de France, Bruyères-le-Châtel, 91297 Arpajon Cedex (France); and others

2016-03-15

The Laser Megajoule (LMJ) facility located at CEA/CESTA started to operate in the early 2014 with two quadruplets (20 kJ at 351 nm) focused on target for the first experimental campaign. We present here the first set of gated x-ray imaging (GXI) diagnostics implemented on LMJ since mid-2014. This set consists of two imaging diagnostics with spatial, temporal, and broadband spectral resolution. These diagnostics will give basic measurements, during the entire life of the facility, such as position, structure, and balance of beams, but they will also be used to characterize gas filled target implosion symmetry and timing, to study x-ray radiography and hydrodynamic instabilities. The design requires a vulnerability approach, because components will operate in a harsh environment induced by neutron fluxes, gamma rays, debris, and shrapnel. Grazing incidence x-ray microscopes are fielded as far as possible away from the target to minimize potential damage and signal noise due to these sources. These imaging diagnostics incorporate microscopes with large source-to-optic distance and large size gated microchannel plate detectors. Microscopes include optics with grazing incidence mirrors, pinholes, and refractive lenses. Spatial, temporal, and spectral performances have been measured on x-ray tubes and UV lasers at CEA-DIF and at Physikalisch-Technische Bundesanstalt BESSY II synchrotron prior to be set on LMJ. GXI-1 and GXI-2 designs, metrology, and first experiments on LMJ are presented here.

Quantitative phase tomography by using x-ray microscope with Foucault knife-edge scanning filter

Energy Technology Data Exchange (ETDEWEB)

Watanabe, Norio; Tsuburaya, Yuji; Shimada, Akihiro; Aoki, Sadao [Faculty of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Ibaraki, 305-8573 (Japan)

2016-01-28

Quantitative phase tomography was evaluated by using a differential phase microscope with a Foucault knife-edge scanning filter. A 3D x-ray phase image of polystyrene beads was obtained at 5.4 keV. The reconstructed refractive index was fairly good agreement with the Henke’s tabulated data.

Quantitative phase tomography by using x-ray microscope with Foucault knife-edge scanning filter

International Nuclear Information System (INIS)

Watanabe, Norio; Tsuburaya, Yuji; Shimada, Akihiro; Aoki, Sadao

2016-01-01

Quantitative phase tomography was evaluated by using a differential phase microscope with a Foucault knife-edge scanning filter. A 3D x-ray phase image of polystyrene beads was obtained at 5.4 keV. The reconstructed refractive index was fairly good agreement with the Henke’s tabulated data

Quantitative phase tomography by using x-ray microscope with Foucault knife-edge scanning filter

Science.gov (United States)

Watanabe, Norio; Tsuburaya, Yuji; Shimada, Akihiro; Aoki, Sadao

2016-01-01

Quantitative phase tomography was evaluated by using a differential phase microscope with a Foucault knife-edge scanning filter. A 3D x-ray phase image of polystyrene beads was obtained at 5.4 keV. The reconstructed refractive index was fairly good agreement with the Henke's tabulated data.

Ray-tracing of shape metrology data of grazing incidence x-ray astronomy mirrors

Science.gov (United States)

Zocchi, Fabio E.; Vernani, Dervis

2008-07-01

A number of future X-ray astronomy missions (e.g. Simbol-X, eROSITA) plan to utilize high throughput grazing incidence optics with very lightweight mirrors. The severe mass specifications require a further optimization of the existing technology with the consequent need of proper optical numerical modeling capabilities for both the masters and the mirrors. A ray tracing code has been developed for the simulation of the optical performance of type I Wolter masters and mirrors starting from 2D and 3D metrology data. In particular, in the case of 2D measurements, a 3D data set is reconstructed on the basis of dimensional references and used for the optical analysis by ray tracing. In this approach, the actual 3D shape is used for the optical analysis, thus avoiding the need of combining the separate contributions of different 2D measurements that require the knowledge of their interactions which is not normally available. The paper describes the proposed approach and presents examples of application on a prototype engineering master in the frame of ongoing activities carried out for present and future X-ray missions.

Residual stress analysis on materials with steep stress gradient by using X-ray incidence at higher angles

International Nuclear Information System (INIS)

Ohya, Shin-ichi; Yoshioka, Yasuo; Maeno, Shigeki

1996-01-01

X-ray stress measurements for isotropic polycrystalline are materials are usually carried out by the sin 2 ψ method under the assumption of no stress gradient in X-ray penetration depth. When a steep stress gradient exists in the vicinity of surface layer, however, non-linear sin 2 ψ relation is observed and the sin 2 ψ method cannot be applied on such cases. Although several X-ray stress analyzers have been developed for materials with steep stress gradient in the surface layer, it is desirable to use diffraction data at higher incident angles of ψ 0 as possible as close on 90 degrees in order to determine the both values of surface stress and stress gradient with high accuracy. In the present study, an X-ray stress analyzer based on Ω geometry was fabricated to enable X-ray incidence at higher angle of ψ 0 . The X-ray detector was positioned on -η side against X-ray incident beam. Both of the residual surface stress and stress gradient were determined by use of the COSψ method on shot-peened steel and silicon nitride specimens. This prototype stress analyzer was found effective to perform a biaxial or triaxial stress analysis. (author)

Status of Mirror Development for the Marshall Grazing Incidence X-ray Spectrometer (MaGIXS)

Science.gov (United States)

Champey, P. R.; Winebarger, A. R.; Kobayashi, K.; Savage, S. L.; Ramsey, B.; Kolodziejczak, J.; Speegle, C.; Young, M.; Kester, T.; Cheimets, P.; Hertz, E.

2017-12-01

The Marshall Grazing Incidence X-ray Spectrometer (MaGIXS) is a NASA sounding rocket instrument designed to observe soft X-ray emissions at 0.5 - 2.0 keV energies (24 - 6 Å) from a solar active region. MaGIXS will, for the first time, obtain spatially resolved spectra of high-temperature, low-emission plasma within an active region core. The unique optical design includes a Wolter I telescope and a 3-optic grazing incidence spectrograph. The spectrograph consists of a finite conjugate, stigmatic mirror pair and a planar varied line space grating. The grazing incidence mirrors are being developed at NASA Marshall Space Flight Center (MSFC) and are produced using electroform nickel-replication techniques, employing the same facilities developed for HERO, FOXSI, ART-XC and IXPE. The MaGIXS mirror mandrels have been fabricated, figured, and have completed the first phase of polishing. A set of three test shells were replicated and exposed to X-rays in the Stray Light Facility (SLF) at MSFC. Here we present results from mandrel metrology and X-ray testing at the SLF. We also discuss the development of a new polishing technique for the MaGIXS mirror mandrels, where we plan to use the Zeeko polishing machine.

Evaluation of an X-ray-excited optical microscope for chemical imaging of metal and other surfaces.

Science.gov (United States)

Sabbe, Pieter-Jan; Dowsett, Mark; Hand, Matthew; Grayburn, Rosie; Thompson, Paul; Bras, Wim; Adriaens, Annemie

2014-12-02

The application of a modular system for the nondestructive chemical imaging of metal and other surfaces is described using heritage metals as an example. The custom-built X-ray-excited optical luminescence (XEOL) microscope, XEOM 1, images the chemical state and short-range atomic order of the top 200 nm of both amorphous and crystalline surfaces. A broad X-ray beam is used to illuminate large areas (up to 4 mm(2)) of the sample, and the resulting XEOL emission is collected simultaneously for each pixel by a charge-coupled device sensor to form an image. The input X-ray energy is incremented across a range typical for the X-ray absorption near-edge structure (XANES) and an image collected for each increment. The use of large-footprint beams combined with parallel detection allows the power density to be kept low and facilitates complete nondestructive XANES mapping on a reasonable time scale. In this study the microscope was evaluated by imaging copper surfaces with well-defined patterns of different corrosion products (cuprite Cu2O and nantokite CuCl). The images obtained show chemical contrast, and filtering the XEOL light allowed different corrosion products to be imaged separately. Absorption spectra extracted from software-selected regions of interest exhibit characteristic XANES fingerprints for the compounds present. Moreover, when the X-ray absorption edge positions were extracted from each spectrum, an oxidation state map of the sample could be compiled. The results show that this method allows one to obtain nondestructive and noninvasive information at the micrometer scale while using full-field imaging.

Experiment and application of soft x-ray grazing incidence optical scattering phenomena

Science.gov (United States)

Chen, Shuyan; Li, Cheng; Zhang, Yang; Su, Liping; Geng, Tao; Li, Kun

2017-08-01

For short wavelength imaging systems，surface scattering effects is one of important factors degrading imaging performance. Study of non-intuitive surface scatter effects resulting from practical optical fabrication tolerances is a necessary work for optical performance evaluation of high resolution short wavelength imaging systems. In this paper, Soft X-ray optical scattering distribution is measured by a soft X-ray reflectometer installed by my lab, for different sample mirrors、wavelength and grazing angle. Then aim at space solar telescope, combining these scattered light distributions, and surface scattering numerical model of grazing incidence imaging system, PSF and encircled energy of optical system of space solar telescope are computed. We can conclude that surface scattering severely degrade imaging performance of grazing incidence systems through analysis and computation.

Combined evaluation of grazing incidence X-ray fluorescence and X-ray reflectivity data for improved profiling of ultra-shallow depth distributions

Energy Technology Data Exchange (ETDEWEB)

Ingerle, D., E-mail: dingerle@ati.ac.at [Atominstitut, Vienna University of Technology, Stadionallee 2, A-1020 Vienna (Austria); Meirer, F. [Inorganic Chemistry and Catalysis, Debye Institute for Nanomaterials Science, Utrecht University, Universiteitsweg 99, 3584 CG Utrecht (Netherlands); Pepponi, G.; Demenev, E.; Giubertoni, D. [MiNALab, CMM-irst, Fondazione Bruno Kessler, Via Sommarive 18, I-38050 Povo (Italy); Wobrauschek, P.; Streli, C. [Atominstitut, Vienna University of Technology, Stadionallee 2, A-1020 Vienna (Austria)

2014-09-01

The continuous downscaling of the process size for semiconductor devices pushes the junction depths and consequentially the implantation depths to the top few nanometers of the Si substrate. This motivates the need for sensitive methods capable of analyzing dopant distribution, total dose and possible impurities. X-ray techniques utilizing the external reflection of X-rays are very surface sensitive, hence providing a non-destructive tool for process analysis and control. X-ray reflectometry (XRR) is an established technique for the characterization of single- and multi-layered thin film structures with layer thicknesses in the nanometer range. XRR spectra are acquired by varying the incident angle in the grazing incidence regime while measuring the specular reflected X-ray beam. The shape of the resulting angle-dependent curve is correlated to changes of the electron density in the sample, but does not provide direct information on the presence or distribution of chemical elements in the sample. Grazing Incidence XRF (GIXRF) measures the X-ray fluorescence induced by an X-ray beam incident under grazing angles. The resulting angle dependent intensity curves are correlated to the depth distribution and mass density of the elements in the sample. GIXRF provides information on contaminations, total implanted dose and to some extent on the depth of the dopant distribution, but is ambiguous with regard to the exact distribution function. Both techniques use similar measurement procedures and data evaluation strategies, i.e. optimization of a sample model by fitting measured and calculated angle curves. Moreover, the applied sample models can be derived from the same physical properties, like atomic scattering/form factors and elemental concentrations; a simultaneous analysis is therefore a straightforward approach. This combined analysis in turn reduces the uncertainties of the individual techniques, allowing a determination of dose and depth profile of the implanted

X-ray imagery

International Nuclear Information System (INIS)

Dhez, P.

1986-01-01

Direct projection, pin diaphragm, lenses, mirrors and holography are used for X images. Each method is examined, radiation source problem is taken in account. For instance, the important role of synchrotron radiation in direct projection is noticed (angiography, microlithography, isotope separation). The pin diaphragm is used for laser-plasma images. Two use techniques of mirrors are presented: in grazing incidence (X-UV telescopes on satellite board) or in normal incidence (new ''laminated'' mirrors). This second technique, which uses interferences, seems to be the unique solution to equip optical cavities of X lasers. More classically, the multilayered mirrors are applicated to X microscopes (with synchrotron radiation). Lenses use diffraction. They lead to scanning X microscopes. At last, reconstruction methods of image are reviewed: different from computer are topography interferometry and holography. These three last ones are precised. In conclusion, the X optics application to two-dimensional material physics is recalled [fr

Development of X-ray excitable luminescent probes for scanning X-ray microscopy

International Nuclear Information System (INIS)

Moronne, M.M.

1999-01-01

Transmission soft X-ray microscopy is now capable of achieving resolutions that are typically 5 times better than the best-visible light microscopes. With expected improvements in zone plate optics, an additional factor of two may be realized within the next few years. Despite the high resolution now available with X-ray microscopes and the high X-ray contrast provided by biological molecules in the soft X-ray region (λ=2-5 nm), molecular probes for localizing specific biological targets have been lacking. To circumvent this problem, X-ray excitable molecular probes are needed that can target unique biological features. In this paper we report our initial results on the development of lanthanide-based fluorescent probes for biological labeling. Using scanning luminescence X-ray microscopy (SLXM, Jacobsen et al., J. Microscopy 172 (1993) 121-129), we show that lanthanide organo-polychelate complexes are sufficiently bright and radiation resistant to be the basis of a new class of X-ray excitable molecular probes capable of providing at least a fivefold improvement in resolution over visible light microscopy. Lanthanide probes, able to bind 80-100 metal ions per molecule, were found to give strong luminescent signals with X-ray doses exceeding 10 8 Gy, and were used to label actin stress fibers and in vitro preparations of polymerized tubulin. (Copyright (c) 1999 Elsevier Science B.V., Amsterdam. All rights reserved.)

X-ray hot plasma diagnostics

International Nuclear Information System (INIS)

Cojocaru, E.

1984-11-01

X-ray plasma emission study is powerful diagnostic tool of hot plasmas. In this review article the main techniques of X-ray plasma emission measurement are shortly presented: X-ray spectrometry using absorbent filters, crystal and grating spectrometers, imaging techniques using pinhole cameras, X-ray microscopes and Fresnel zone plate cameras, X-ray plasma emission calorimetry. Advances in these techniques with examples for different hot plasma devices are also presentes. (author)

X-ray filter for x-ray powder diffraction

Science.gov (United States)

Sinsheimer, John Jay; Conley, Raymond P.; Bouet, Nathalie C. D.; Dooryhee, Eric; Ghose, Sanjit

2018-01-23

Technologies are described for apparatus, methods and systems effective for filtering. The filters may comprise a first plate. The first plate may include an x-ray absorbing material and walls defining first slits. The first slits may include arc shaped openings through the first plate. The walls of the first plate may be configured to absorb at least some of first x-rays when the first x-rays are incident on the x-ray absorbing material, and to output second x-rays. The filters may comprise a second plate spaced from the first plate. The second plate may include the x-ray absorbing material and walls defining second slits. The second slits may include arc shaped openings through the second plate. The walls of the second plate may be configured to absorb at least some of second x-rays and to output third x-rays.

Thin-film thickness measurement using x-ray peak ratioing in the scanning electron microscope

International Nuclear Information System (INIS)

Elliott, N.E.; Anderson, W.E.; Archuleta, T.A.; Stupin, D.M.

1981-01-01

The procedure used to measure laser target film thickness using a scanning electron microscope is summarized. This method is generally applicable to any coating on any substrate as long as the electron energy is sufficient to penetrate the coating and the substrate produces an x-ray signal which can pass back through the coating and be detected

X-ray tube

International Nuclear Information System (INIS)

Webley, R.S.

1975-01-01

The object of the invention described is to provide an X-ray tube providing a scanned X-ray output which does not require a scanned electron beam. This is obtained by an X-ray tube including an anode which is rotatable about an axis, and a source of a beam of energy, for example an electron beam, arranged to impinge on a surface of the anode to generate X-radiation substantially at the region of incidence on the anode surface. The anode is rotatable about the axis to move the region of incidence over the surface. The anode is so shaped that the rotation causes the region of incidence to move in a predetermined manner relative to fixed parts of the tube so that the generated X-radiation is scanned in a predetermined manner relative to the tube. (UK)

Hard-x-ray phase-difference microscopy with a low-brilliance laboratory x-ray source

International Nuclear Information System (INIS)

Kuwabara, Hiroaki; Yashiro, Wataru; Harasse, Sebastien; Momose, Atsushi; Mizutani, Haruo

2011-01-01

We have developed a hard-X-ray phase-imaging microscopy method using a low-brilliance X-ray source. The microscope consists of a sample, a Fresnel zone plate, a transmission grating, and a source grating creating an array of mutually incoherent X-ray sources. The microscope generates an image exhibiting twin features of the sample with opposite signs separated by a distance, which is processed to generate a phase image. The method is quantitative even for non-weak-phase objects that are difficult to be quantitatively examined by the widely used Zernike phase-contrast microscopy, and it has potentially broad applications in the material and biological science fields. (author)

Arrangement for X-ray shield

International Nuclear Information System (INIS)

1980-01-01

X-ray screen unit consisting of a light transmissive carrier onto which scintillation material is deposited, which is able to generate light under the influence of incident X-ray irradiation, characterised in that the X-ray screen comprises a number of sectors, wherein the surface with respect to the incident X-radiation is maintained at an acute angle. (G.C.)

Design of KB complex type microscope for ICF x-ray diagnostics

Science.gov (United States)

Xie, Qing; Mu, Baozhong; Li, Yaran; Huang, Qiushi; Wang, Zhanshan; Cao, Zhurong; Dong, Jianjun; Liu, Shenye; Ding, Yongkun

2016-09-01

In the field of target diagnostics for Initial Confinement Fusion experiment, high resolution X-ray imaging system is seriously necessary to record the evolution details of target ablation-front disturbance at different energy points of backlight conditions. Kirkpatrick-Baez mirror is a wide used imaging system to achieve a large efficient field of view with high spatial resolution and energy transmitting capability. In this paper, we designed a novel type of reflective microscope based on Kirkpatrick-Baez structure, and this system can achieve 5μm spatial resolution at 600μm field of view specific energy point in one dimension.

Formation of a Parasitophorous Vacuole in a Nonadequate Experimental Host: Electron Microscopical and X-Ray Microanalytical Study

Czech Academy of Sciences Publication Activity Database

Žižka, Zdeněk

2005-01-01

Roč. 50, č. 1 (2005), 05-12 ISSN 0015-5632 Institutional research plan: CEZ:AV0Z50200510 Keywords : electron microscopical * x-ray Subject RIV: EE - Microbiology, Virology Impact factor: 0.918, year: 2005

Stress measurements by multi-reflection grazing-incidence X-ray diffraction method (MGIXD) using different radiation wavelengths and different incident angles

International Nuclear Information System (INIS)

Marciszko, Marianna; Baczmański, Andrzej; Braham, Chedly; Wróbel, Mirosław; Wroński, Sebastian; Cios, Grzegorz

2017-01-01

The presented study introduces the development of the multi-reflection grazing-incidence X-ray diffraction method (MGIXD) for residual stress determination. The proposed new methodology is aimed at obtaining more reliable experimental data and increasing the depth of non-destructive stress determination below the sample surface. To verify proposed method measurements were performed on a classical X-ray diffractometer (Cu Kα radiation) and using synchrotron radiation (three different wavelengths: λ = 1.2527 Å, λ = 1.5419 Å and λ = 1.7512 Å). The Al2017 alloy subjected to three different surface treatments was investigated in this study. The obtained results showed that the proposed development of MGIXD method, in which not only different incident angles but also different wavelengths of X-ray are used, can be successfully applied for residual stress determination, especially when stress gradients are present in the sample.

Multiscale structural study using scanning X-ray microscope

International Nuclear Information System (INIS)

Ohsumi, Hiroyuki; Arima, Taka-hisa

2016-01-01

Correspondence between structures at the atomic- and meso-scales can be given by scanning X-ray microscopy integrated with polarized X-ray diffractometry. Symmetry is the common structural feature available across multiple hierarchies. This article introduces a symmetry evaluation technique based on polarized X-ray diffractometry and describes two embodiments: chirality domain observation and antiferromagnetic domain observation. Multiscale structural studies would play an important role in uncovering universality of hierarchical structure. (author)

Surface quality inspection of PbWO4 crystals by grazing incidence X-ray diffraction

International Nuclear Information System (INIS)

Mengucci, P.; Di Cristoforo, A.; Lebeau, M.; Majni, G.; Paone, N.; Pietroni, P.; Rinaldi, D.

2005-01-01

High-quality scintillating crystals are required for applications in radiographic systems and high-energy physics detectors to achieve the specified optical properties. In order to study the state of the single crystals surface we propose the use of the grazing incidence X-ray diffraction (GID) technique. This technique allows performing a depth profiling of the sample by changing the incidence angle of the X-ray beam with respect to the sample surface. In this work, two samples of a large PbWO 4 (PWO) single crystal exhibiting different surface roughness values have been studied. Results have shown that GID is a suitable technique for surface quality inspection

X-ray microtomography

International Nuclear Information System (INIS)

Dunsmuir, J.H.; Ferguson, S.R.; D'Amico, K.L.; Stokes, J.P.

1991-01-01

In this paper the authors describe the application of a new high-resolution X-ray tomographic microscope to the study of porous media. The microscope was designed to exploit the properties of a synchrotron X-ray source to perform three dimensional tomography on millimeter sized objects with micron resolution and has been used in materials science studies with both synchrotron and conventional and synchrotron sources will be compared. In this work the authors have applied the microscope to measure the three dimensional structure of fused bead packs and berea sandstones with micron resolution and have performed preliminary studies of flow in these media with the microscope operated in a digital subtraction radiography mode. Computer graphics techniques have been applied to the data to visually display the structure of the pore body system. Tomographic imaging after flow experiments should detect the structure of the oil-water interface in the pore network and this work is ongoing

Microscopic bosonization of band structures: x-ray processes beyond the Fermi edge

Science.gov (United States)

Snyman, Izak; Florens, Serge

2017-11-01

Bosonization provides a powerful analytical framework to deal with one-dimensional strongly interacting fermion systems, which makes it a cornerstone in quantum many-body theory. However, this success comes at the expense of using effective infrared parameters, and restricting the description to low energy states near the Fermi level. We propose a radical extension of the bosonization technique that overcomes both limitations, allowing computations with microscopic lattice Hamiltonians, from the Fermi level down to the bottom of the band. The formalism rests on the simple idea of representating the fermion kinetic term in the energy domain, after which it can be expressed in terms of free bosonic degrees of freedom. As a result, one- and two-body fermionic scattering processes generate anharmonic boson-boson interactions, even in the forward channel. We show that up to moderate interaction strengths, these non-linearities can be treated analytically at all energy scales, using the x-ray emission problem as a showcase. In the strong interaction regime, we employ a systematic variational solution of the bosonic theory, and obtain results that agree quantitatively with an exact diagonalization of the original one-particle fermionic model. This provides a proof of the fully microscopic character of bosonization, on all energy scales, for an arbitrary band structure. Besides recovering the known x-ray edge singularity at the emission threshold, we find strong signatures of correlations even at emission frequencies beyond the band bottom.

Instrumental fundamental parameters and selected applications of the microfocus X-ray fluorescence analysis at a scanning electron microscope

International Nuclear Information System (INIS)

Rackwitz, Vanessa

2012-01-01

For a decade X-ray sources have been commercially available for the microfocus X-ray fluorescence analysis (μ-XRF) and offer the possibility of extending the analytics at a scanning electron microscope (SEM) with an attached energy dispersive X-ray spectrometer (EDS). By using the μ-XRF it is possible to determine the content of chemical elements in a microscopic sample volume in a quantitative, reference-free and non-destructive way. For the reference-free quantification with the XRF the Sherman equation is referred to. This equation deduces the intensity of the detected X-ray intensity of a fluorescence peak to the content of the element in the sample by means of fundamental parameters. The instrumental fundamental parameters of the μ-XRF at a SEM/EDS system are the excitation spectrum consisting of X-ray tube spectrum and the transmission of the X-ray optics, the geometry and the spectrometer efficiency. Based on a calibrated instrumentation the objectives of this work are the development of procedures for the characterization of all instrumental fundamental parameters as well as the evaluation and reduction of their measurement uncertainties: The algorithms known from the literature for the calculation of X-ray tube spectrum are evaluated with regard to their deviations in the spectral distribution. Within this work a novel semi-empirical model is improved with respect to its uncertainties and enhanced in the low energy range as well as extended for another three anodes. The emitted X-ray tube spectrum is calculated from the detected one, which is measured at an especially developed setup for the direct measurement of X-ray tube spectra. This emitted X-ray tube spectrum is compared to the one calculated on base of the model of this work. A procedure for the determination of the most important parameters of an X-ray semi-lens in parallelizing mode is developed. The temporal stability of the transmission of X-ray full lenses, which have been in regular use at

X-ray microscopy resource center at the Advanced Light Source

International Nuclear Information System (INIS)

Meyer-Ilse, W.; Koike, M.; Beguiristain, R.; Maser, J.; Attwood, D.

1992-07-01

An x-ray microscopy resource center for biological x-ray imaging vvill be built at the Advanced Light Source (ALS) in Berkeley. The unique high brightness of the ALS allows short exposure times and high image quality. Two microscopes, an x-ray microscope (XM) and a scanning x-ray microscope (SXM) are planned. These microscopes serve complementary needs. The XM gives images in parallel at comparable short exposure times, and the SXM is optimized for low radiation doses applied to the sample. The microscopes extend visible light microscopy towards significantly higher resolution and permit images of objects in an aqueous medium. High resolution is accomplished by the use of Fresnel zone plates. Design considerations to serve the needs of biological x-ray microscopy are given. Also the preliminary design of the microscopes is presented. Multiple wavelength and multiple view images will provide elemental contrast and some degree of 3D information

New trends in space x-ray optics

Science.gov (United States)

Hudec, R.; Maršíková, V.; Pína, L.; Inneman, A.; Skulinová, M.

2017-11-01

The X-ray optics is a key element of various X-ray telescopes, X-ray microscopes, as well as other X-ray imaging instruments. The grazing incidence X-ray lenses represent the important class of X-ray optics. Most of grazing incidence (reflective) X-ray imaging systems used in astronomy but also in other (laboratory) applications are based on the Wolter 1 (or modified) arrangement. But there are also other designs and configurations proposed, used and considered for future applications both in space and in laboratory. The Kirkpatrick-Baez (K-B) lenses as well as various types of Lobster-Eye optics and MCP/Micropore optics serve as an example. Analogously to Wolter lenses, the X-rays are mostly reflected twice in these systems to create focal images. Various future projects in X-ray astronomy and astrophysics will require large segments with multiple thin shells or foils. The large Kirkpatrick-Baez modules, as well as the large Lobster-Eye X-ray telescope modules in Schmidt arrangement may serve as examples. All these space projects will require high quality and light segmented shells (bent or flat foils) with high X-ray reflectivity and excellent mechanical stability. The Multi Foil Optics (MFO) approach represent a promising alternative for both LE and K-B X-ray optical modules. Several types of reflecting substrates may be considered for these applications, with emphasis on thin float glass sheets and, more recently, high quality silicon wafers. This confirms the importance of non- Wolter X-ray optics designs for the future. Future large space X-ray telescopes (such as IXO) require precise and light-weight X-ray optics based on numerous thin reflecting shells. Novel approaches and advanced technologies are to be exploited and developed. In this contribution, we refer on results of tested X-ray mirror shells produced by glass thermal forming (GTF) and by shaping Si wafers. Both glass foils and Si wafers are commercially available, have excellent surface

Determination of the resolution of the x-ray microscope XM-1 at beamline 6.1

Energy Technology Data Exchange (ETDEWEB)

Heck, J.M.; Meyer-Ilse, W.; Attwood, D.T. [Ernest Orlando Lawrence Berkeley National Lab., CA (United States)

1997-04-01

Resolution determination in x-ray microscopy is a complex issue which depends on many factors. Many different criteria and experimental setups are used to characterize resolution. Some of the important factors affecting resolution include the partial coherence and spectrum of the illumination. The purpose of this research has been to measure the resolution of XM-1 at beamline 6.1 taking into account these factors, and to compare the measurements to theoretical calculations. The x-ray microscope XM-1, built by the Center for X-ray Optics (CXRO), has been operational since 1994 at the Advanced Light Source at E.O. Lawrence Berkeley National Laboratory. It is of the conventional (i.e. full-field) type, utilizing zone plate optics. ALS bending magnet radiation is focused by a condenser zone plate onto a monochromator pinhole immediately in front of the sample. X-rays transmitted through the sample are focused by a micro-zone plate onto a CCD camera. The pinhole and the condenser with a central stop constitute a linear monochromator. The spectral distribution of the light illuminating the sample has been calculated assuming geometrical optics.

Aplanatic telescopes based on Schwarzschild optical configuration: from grazing incidence Wolter-like x-ray optics to Cherenkov two-mirror normal incidence telescopes

Science.gov (United States)

Sironi, Giorgia

2017-09-01

At the beginning of XX century Karl Schwarzschild defined a method to design large-field aplanatic telescopes based on the use of two aspheric mirrors. The approach was then refined by Couder (1926) who, in order to correct for the astigmatic aberration, introduced a curvature of the focal plane. By the way, the realization of normal-incidence telescopes implementing the Schwarzschild aplanatic configuration has been historically limited by the lack of technological solutions to manufacture and test aspheric mirrors. On the other hand, the Schwarzschild solution was recovered for the realization of coma-free X-ray grazing incidence optics. Wolter-like grazing incidence systems are indeed free of spherical aberration, but still suffer from coma and higher order aberrations degrading the imaging capability for off-axis sources. The application of the Schwarzschild's solution to X-ray optics allowed Wolter to define an optical system that exactly obeys the Abbe sine condition, eliminating coma completely. Therefore these systems are named Wolter-Schwarzschild telescopes and have been used to implement wide-field X-ray telescopes like the ROSAT WFC and the SOHO X-ray telescope. Starting from this approach, a new class of X-ray optical system was proposed by Burrows, Burg and Giacconi assuming polynomials numerically optimized to get a flat field of view response and applied by Conconi to the wide field x-ray telescope (WFXT) design. The Schwarzschild-Couder solution has been recently re-discovered for the application to normal-incidence Cherenkov telescopes, thanks to the suggestion by Vassiliev and collaborators. The Italian Institute for Astrophysics (INAF) realized the first Cherenkov telescope based on the polynomial variation of the Schwarzschild configuration (the so-called ASTRI telescope). Its optical qualification was successfully completed in 2016, demonstrating the suitability of the Schwarzschild-like configuration for the Cherenkov astronomy requirements

Short-wavelength soft-x-ray laser pumped in double-pulse single-beam non-normal incidence

International Nuclear Information System (INIS)

Zimmer, D.; Ros, D.; Guilbaud, O.; Habib, J.; Kazamias, S.; Zielbauer, B.; Bagnoud, V.; Ecker, B.; Aurand, B.; Kuehl, T.; Hochhaus, D. C.; Neumayer, P.

2010-01-01

We demonstrated a 7.36 nm Ni-like samarium soft-x-ray laser, pumped by 36 J of a neodymium:glass chirped-pulse amplification laser. Double-pulse single-beam non-normal-incidence pumping was applied for efficient soft-x-ray laser generation. In this case, the applied technique included a single-optic focusing geometry for large beam diameters, a single-pass grating compressor, traveling-wave tuning capability, and an optimized high-energy laser double pulse. This scheme has the potential for even shorter-wavelength soft-x-ray laser pumping.

X-ray scattering in X-ray fluorescence spectra with X-ray tube excitation - Modelling, experiment, and Monte-Carlo simulation

International Nuclear Information System (INIS)

Hodoroaba, V.-D.; Radtke, M.; Vincze, L.; Rackwitz, V.; Reuter, D.

2010-01-01

X-ray scattering may contribute significantly to the spectral background of X-ray fluorescence (XRF) spectra. Based on metrological measurements carried out with a scanning electron microscope (SEM) having attached a well characterised X-ray source (polychromatic X-ray tube) and a calibrated energy dispersive X-ray spectrometer (EDS) the accuracy of a physical model for X-ray scattering is systematically evaluated for representative samples. The knowledge of the X-ray spectrometer efficiency, but also of the spectrometer response functions makes it possible to define a physical spectral background of XRF spectra. Background subtraction relying on purely mathematical procedures is state-of-the-art. The results produced by the analytical model are at least as reliable as those obtained by Monte-Carlo simulations, even without considering the very challenging contribution of multiple scattering. Special attention has been paid to Compton broadening. Relevant applications of the implementation of the analytical model presented in this paper are the prediction of the limits of detection for particular cases or the determination of the transmission of X-ray polycapillary lenses.

Direct comparison of soft x-ray images of organelles with optical fluorescence images

International Nuclear Information System (INIS)

Ishino, Masahiko; Kado, Masataka; Kishimoto, Maki; Nishikino, Masaharu; Ohba, Toshiyuki; Kaihori, Takeshi; Kawachi, Tetsuya; Tamotsu, Satoshi; Yasuda, Keiko; Mikata, Yuji; Shinohara, Kunio

2011-01-01

Soft x-ray microscopes operating in the water window region are capable of imaging living hydrated cells. Up to now, we have been able to take some soft x-ray images of living cells by the use of a contact x-ray microscope system with laser produced plasma soft x-ray source. Since the soft x-ray images are different from the optical images obtained with an ordinary microscope, it is very important to identify what is seen in the x-ray images. Hence, we have demonstrated the direct comparison between the images of organelles obtained with a fluorescence microscope and those with a soft x-ray microscope. Comparing the soft x-ray images to the fluorescence images, the fine structures of the organelles could be identified and observed. (author)

A laboratory 8 keV transmission full-field x-ray microscope with a polycapillary as condenser for bright and dark field imaging

Energy Technology Data Exchange (ETDEWEB)

Baumbach, S., E-mail: baumbach@rheinahrcampus.de; Wilhein, T. [Institute for X-Optics, University of Applied Sciences Koblenz, RheinAhrCampus Remagen, Joseph-Rovan-Allee 2, D-53424 Remagen (Germany); Kanngießer, B.; Malzer, W. [Institute for Optics and Atomic Physics, Technical University of Berlin, Hardenbergstrasse 36, D-10623 Berlin (Germany); Stiel, H. [Max-Born-Institute, Max-Born-Strasse 2A, D-12489 Berlin (Germany)

2015-08-15

This article introduces a laboratory setup of a transmission full-field x-ray microscope at 8 keV photon energy. The microscope operates in bright and dark field imaging mode with a maximum field of view of 50 μm. Since the illumination geometry determines whether the sample is illuminated homogeneously and moreover, if different imaging methods can be applied, the condenser optic is one of the most significant parts. With a new type of x-ray condenser, a polycapillary optic, we realized bright field imaging and for the first time dark field imaging at 8 keV photon energy in a laboratory setup. A detector limited spatial resolution of 210 nm is measured on x-ray images of Siemens star test patterns.

Advanced Nanoscale Characterization of Cement Based Materials Using X-Ray Synchrotron Radiation: A Review

KAUST Repository

Chae, Sejung R.

2013-05-22

We report various synchrotron radiation laboratory based techniques used to characterize cement based materials in nanometer scale. High resolution X-ray transmission imaging combined with a rotational axis allows for rendering of samples in three dimensions revealing volumetric details. Scanning transmission X-ray microscope combines high spatial resolution imaging with high spectral resolution of the incident beam to reveal X-ray absorption near edge structure variations in the material nanostructure. Microdiffraction scans the surface of a sample to map its high order reflection or crystallographic variations with a micron-sized incident beam. High pressure X-ray diffraction measures compressibility of pure phase materials. Unique results of studies using the above tools are discussed-a study of pores, connectivity, and morphology of a 2,000 year old concrete using nanotomography; detection of localized and varying silicate chain depolymerization in Al-substituted tobermorite, and quantification of monosulfate distribution in tricalcium aluminate hydration using scanning transmission X-ray microscopy; detection and mapping of hydration products in high volume fly ash paste using microdiffraction; and determination of mechanical properties of various AFm phases using high pressure X-ray diffraction. © 2013 The Author(s).

Comparison of the incidence of oncogenic transformation produced by x-rays, misonidazole, and chemotherapy agents

International Nuclear Information System (INIS)

Hall, E.J.; Miller, R.C.; Osmak, R.; Zimmerman, M.

1982-01-01

An established line of mouse fibroblasts (10T1/2 cells) cultured in vitro was used to compare the incidence of oncogenic transformation produced by x rays, the hypoxic cell radiosensitizer misonidazole, and a range of commonly used chemotherapy agents. A 3-day exposure to misonidazole at a concentration obtainable during treatment produced an incidence of transformation similar to that of about 50 rad. When chemotherapy agents were tested at concentrations comparable to those used clinically and matched to produce similar cell killing, the incidence of transformation varied widely: some agents, such as vincristine, did not produce transformation at a level detectable above background, while others, such as cis-plantinum, appear to be potent carcinogens and produce transformation at a rate orders of magnitude higher than that achieved with x rays

Si(Li) X-ray detector

International Nuclear Information System (INIS)

Yuan Xianglin; Li Zhiyong; Hong Xiuse

1990-08-01

The fabrication technology of the 10∼80 mm 2 Si(Li) X-ray detectors are described and some problems concerning technology and measurement are discussed. The specifications of the detectors are shown as well. The Si(Li) X-ray detector is a kind of low energy X-ray detectors. Owing to very high energy resolution, fine linearity and high detection efficiency in the range of low energy X-rays, it is widely used in the fields of nuclear physics, medicine, geology and environmental protection, etc,. It is also a kernel component for the scanning electron microscope and X-ray fluorescence analysis systems

Perfect-crystal x-ray optics to treat x-ray coherence

International Nuclear Information System (INIS)

Yamazaki, Hiroshi; Ishikawa, Tetsuya

2007-01-01

X-ray diffraction of perfect crystals, which serve as x-ray monochromator and collimator, modifies coherence properties of x-ray beams. From the time-dependent Takagi-Taupin equations that x-ray wavefields obey in crystals, the reflected wavefield is formulated as an integral transform of a general incident wavefield with temporal and spatial inhomogeneity. A reformulation of rocking-curve profiles from the field solution of the Takagi-Taupin equations allows experimental evaluation of the mutual coherence function of x-ray beam. The rigorous relationship of the coherence functions between before and after reflection clarifies how the coherence is transferred by a crystal. These results will be beneficial to developers of beamline optics for the next generation synchrotron sources. (author)

A new spectrometer for grazing incidence X-ray fluorescence for the characterization of Arsenic implants and Hf based high-k layers

International Nuclear Information System (INIS)

Ingerle, D.; Meirer, F.; Zoeger, N.; Pepponi, G.; Giubertoni, D.; Steinhauser, G.; Wobrauschek, P.; Streli, C.

2010-01-01

Grazing Incidence X-ray Fluorescence Analysis (GIXRF) is a powerful technique for depth-profiling and characterization of thin layers in depths up to a few hundred nanometers. By measurement of fluorescence signals at various incidence angles Grazing Incidence X-ray Fluorescence Analysis provides information on depth distribution and total dose of the elements in the layers. The technique is very sensitive even in depths of a few nanometers. As Grazing Incidence X-ray Fluorescence Analysis does not provide unambigous depth profile information and needs a realistic input depth profile for fitting, in the context of the EC funded European Integrated Activity of Excellence and Networking for Nano and Micro-Electronics Analysis (ANNA) Grazing Incidence X-ray Fluorescence Analysis is used as a complementary technique to Secondary Ion Mass Spectrometry (SIMS) for the characterization of Ultra Shallow Junctions (USJ). A measuring chamber was designed, constructed and tested to meet the requirements of Grazing Incidence X-ray Fluorescence Analysis. A measurement protocol was developed and tested. Some results for As implants as well as Hf based high k layers on Silicon are shown. For the determination of the bulk As content of the wafers, Instrumental Neutron Activation Analysis has also been applied for comparison.

Relation between psi-splitting and microscopic residual shear stresses in x-ray stress measurement on uni-directionally deformed layers

International Nuclear Information System (INIS)

Hanabusa, Takao; Fujiwara, Haruo

1982-01-01

The psi-splitting behaviors were investigated for the ground and the milled surface layers of both iron and high speed steel in order to find out the relation among microscopic residual shear stresses. For the high speed steel, the X-ray elastic constants and the residual strains were measured on the carbide phase as well as on the matrix phase. It was clarified that the psi-splitting was caused by a combination of the selective nature of X-ray diffractions and the microscopic residual shear stresses within the interior of cells and the carbide particles. The volume fraction occupied by the cell walls and the residual shear stresses sustained by them were estimated from the equilibrium condition of the microscopic residual shear stresses. The distributions of residual stresses over the deformed layers indicate that the thermal effect is dominant in grinding and the mechanical effect is dominant in milling for forming residual stresses. (author)

Semiconductor X-ray detectors

CERN Document Server

Lowe, Barrie Glyn

2014-01-01

Identifying and measuring the elemental x-rays released when materials are examined with particles (electrons, protons, alpha particles, etc.) or photons (x-rays and gamma rays) is still considered to be the primary analytical technique for routine and non-destructive materials analysis. The Lithium Drifted Silicon (Si(Li)) X-Ray Detector, with its good resolution and peak to background, pioneered this type of analysis on electron microscopes, x-ray fluorescence instruments, and radioactive source- and accelerator-based excitation systems. Although rapid progress in Silicon Drift Detectors (SDDs), Charge Coupled Devices (CCDs), and Compound Semiconductor Detectors, including renewed interest in alternative materials such as CdZnTe and diamond, has made the Si(Li) X-Ray Detector nearly obsolete, the device serves as a useful benchmark and still is used in special instances where its large, sensitive depth is essential. Semiconductor X-Ray Detectors focuses on the history and development of Si(Li) X-Ray Detect...

On the wide-energy-range tuning of x-ray photoemission electron microscope optics for the observation of the photoelectrons excited by several keV x-rays

International Nuclear Information System (INIS)

Yasufuku, H.; Yoshikawa, H.; Kimura, M.; Vlaicu, A.M.; Kato, M.; Kudo, M.; Fujikata, J.; Fukushima, S.

2006-01-01

We have newly developed an x-ray photoemission electron microscope (XPEEM) which uses both soft x-rays and hard x-rays at the undulator beam line BL15XU in the synchrotron radiation (SR) facility SPring-8 to observe various practical materials. In combination with an energy analyzer and high brilliant x-ray source, the detection of high kinetic energy inner-shell photoelectrons is essential for revealing the chemical properties of specimen subsurfaces or buried interfaces, owing to long inelastic mean free path of the high kinetic energy photoelectrons. The most significant result in our design is the new combined electric and magnetic field objective lens in which the magnetic field penetrates up to the sample surface. This allows the measurement with high spatial resolution of both low intensity images of inner-shell photoelectrons with high kinetic energy and high intensity images of secondary electrons. By using the sample bias scan method, we can easily change the focus condition of the objective lens in order to allow the energy filtered imaging with photoelectrons having the kinetic energy in a wide range (1-10 000 eV). By the combination of high brilliant SR x-rays, the new objective lens, and sample bias method, our XPEEM can successfully obtain the microarea x-ray photoelectron spectra and energy filtered XPEEM images of inner-shell photoelectrons, such as Si 1s, without any surface cleaning procedure. The energy filtered XPEEM image using photoelectrons from deep inner shells, Si 1s, was obtained for the first time

Analysis of thin films prepared by vacuum-evaporation and dropping solution by Takeoff Angle-Dependent X-Ray Fluorescence spectroscopy at glancing incidence

International Nuclear Information System (INIS)

Tsuji, Kouichi; Hirokawa, Kichinosuke; Mitose, Kengo.

1995-01-01

We have introduced Takeoff Angle-Dependent X-Ray Fluorescence (TAD-XRF) method for thin film and surface analysis. In this method, the sample on the optically flat substrate is irradiated with the glancing incidence of the primary X-ray, and the fluorescent X-rays emitted from the sample are detected at the glancing takeoff angle. We had previously calculated the relationship between the fluorescent X-ray intensity and the takeoff angle at the glancing incidence. The characterization of the thin film is achieved by investigating the dependence of the fluorescent X-ray intensity on the takeoff angle with the calculated curve. Using this analytical method, we have reported the results of the TAD-XRF measured for the evaporated thin films and the dried films from dropping solution in this paper. The effect of the thickness of the thin film, the density of the substrate and the incident angle on the TAD-XRF curve has been reported. In the case of the dried film from the dropping solution, a broad peak was observed at the takeoff angle which was close to the critical angle for the total reflection of the fluorescent X-ray in the TAD-XRF curve. This broad peak was explained by the double-excitation of the incident beam and the refracted beam of the fluorescent X-ray with the assumption that the X-ray which has a same wavelength to the observed fluorescent X-ray impinges upon the sample surface, because the reciprocity theorem is expected in the X-ray region. (author)

X-ray radiation damage of organic semiconductor thin films during grazing incidence diffraction experiments

Energy Technology Data Exchange (ETDEWEB)

Neuhold, A., E-mail: alfred.neuhold@tugraz.at [Institute of Solid State Physics, Graz University of Technology, Graz (Austria); Novak, J.; Flesch, H.-G.; Moser, A.; Djuric, T. [Institute of Solid State Physics, Graz University of Technology, Graz (Austria); Grodd, L.; Grigorian, S.; Pietsch, U. [Institute of Physics, University Siegen (Germany); Resel, R. [Institute of Solid State Physics, Graz University of Technology, Graz (Austria)

2012-08-01

Since modern synchrotrons with highly intense X-ray beams are in use to investigate organic materials, the stability of soft matter materials during beam exposure is a crucial issue. Grazing incidence X-ray diffraction and specular X-ray reflectivity measurements were performed on thin films of organic semiconducting materials, like poly(3-hexylthiophene) (P3HT), sexithiophene and pentacene. These films were irradiated with an average flux density between 10{sup 15} and 10{sup 16} photons/(s mm{sup 2}) and evidenced a different stability in synchrotron X-ray radiation. The semi-crystalline P3HT showed a clear intensity decrease of the 1 0 0 Bragg peak and 0 2 0 Bragg peak compared to the rather stable diffraction features of the molecular crystals sexithiophene and pentacene. The difference in synchrotron X-ray radiation stability is explained by the interaction of the X-ray beam with the individual chemical components in the molecules as well as by the different crystallinities of the materials. Furthermore, the semi-crystalline P3HT film exhibited an increase of film thickness after irradiation and the surface roughness slightly decreased. To summarize, this study shows a strong influence of synchrotron X-ray radiation to specific organic thin films like e.g. P3HT, while others like pentacene and sexithiophene are observed as quite stable.

Novel micro-reactor flow cell for investigation of model catalysts using in situ grazing-incidence X-ray scattering.

Science.gov (United States)

Kehres, Jan; Pedersen, Thomas; Masini, Federico; Andreasen, Jens Wenzel; Nielsen, Martin Meedom; Diaz, Ana; Nielsen, Jane Hvolbæk; Hansen, Ole; Chorkendorff, Ib

2016-03-01

The design, fabrication and performance of a novel and highly sensitive micro-reactor device for performing in situ grazing-incidence X-ray scattering experiments of model catalyst systems is presented. The design of the reaction chamber, etched in silicon on insulator (SIO), permits grazing-incidence small-angle X-ray scattering (GISAXS) in transmission through 10 µm-thick entrance and exit windows by using micro-focused beams. An additional thinning of the Pyrex glass reactor lid allows simultaneous acquisition of the grazing-incidence wide-angle X-ray scattering (GIWAXS). In situ experiments at synchrotron facilities are performed utilizing the micro-reactor and a designed transportable gas feed and analysis system. The feasibility of simultaneous in situ GISAXS/GIWAXS experiments in the novel micro-reactor flow cell was confirmed with CO oxidation over mass-selected Ru nanoparticles.

Electrochemically adsorbed Pb on Ag (111) studied with grazing- incidence x-ray scattering

International Nuclear Information System (INIS)

Kortright, J.B.; Ross, P.N.; Melroy, O.R.; Toney, M.F.; Borges, G.L.; Samant, M.G.

1989-04-01

Grazing-incidence x-ray scattering studies of the evolution of electrochemically deposited layers of lead on silver (111) as a function of applied electrochemical potential are presented. Measurements were made with the adsorbed layers in contact with solution in a specially designed sample cell. The observed lead structures are a function of the applied potential and range from an incommensurate monolayer, resulting from underpotential deposition, to randomly oriented polycrystalline bulk lead, resulting from lower deposition potentials. These early experiments demonstrate the ability of in situ x-ray diffraction measurements to determine structures associated with electrochemical deposition. 6 refs., 4 figs

X-ray microscopy in Aarhus

International Nuclear Information System (INIS)

Uggerhoej, Erik; Abraham-Peskir, Joanna V.

2000-01-01

The Aarhus imaging soft X-ray microscope is now a busy multi-user facility. The optical set-up will be described and project highlights discussed. a) Metal-induced structural changes in whole cells in solution. The effects of aluminum, copper, nickel and zinc on protozoa investigated by using a combination of light microscopy, confocal scanning laser microscopy and X-ray microscopy. b) Botanical studies by X-ray microscopy used to compliment electron microscopy studies. c) Sludge morphology and iron precipitation in Danish freshwater plants by combining X-ray, scanning electron and transmission electron microscopy

Can X-ray spectrum imaging replace backscattered electrons for compositional contrast in the scanning electron microscope?

Science.gov (United States)

Newbury, Dale E; Ritchie, Nicholas W M

2011-01-01

The high throughput of the silicon drift detector energy dispersive X-ray spectrometer (SDD-EDS) enables X-ray spectrum imaging (XSI) in the scanning electron microscope to be performed in frame times of 10-100 s, the typical time needed to record a high-quality backscattered electron (BSE) image. These short-duration XSIs can reveal all elements, except H, He, and Li, present as major constituents, defined as 0.1 mass fraction (10 wt%) or higher, as well as minor constituents in the range 0.01-0.1 mass fraction, depending on the particular composition and possible interferences. Although BSEs have a greater abundance by a factor of 100 compared with characteristic X-rays, the strong compositional contrast in element-specific X-ray maps enables XSI mapping to compete with BSE imaging to reveal compositional features. Differences in the fraction of the interaction volume sampled by the BSE and X-ray signals lead to more delocalization of the X-ray signal at abrupt compositional boundaries, resulting in poorer spatial resolution. Improved resolution in X-ray elemental maps occurs for the case of a small feature composed of intermediate to high atomic number elements embedded in a matrix of lower atomic number elements. XSI imaging strongly complements BSE imaging, and the SDD-EDS technology enables an efficient combined BSE-XSI measurement strategy that maximizes the compositional information. If 10 s or more are available for the measurement of an area of interest, the analyst should always record the combined BSE-XSI information to gain the advantages of both measures of compositional contrast. Copyright © 2011 Wiley Periodicals, Inc.

Revisiting Bragg's X-ray microscope: scatter based optical transient grating detection of pulsed ionising radiation.

Science.gov (United States)

Fullagar, Wilfred K; Paganin, David M; Hall, Chris J

2011-06-01

Transient optical gratings for detecting ultrafast signals are routine for temporally resolved photochemical investigations. Many processes can contribute to the formation of such gratings; we indicate use of optically scattering centres that can be formed with highly variable latencies in different materials and devices using ionising radiation. Coherent light scattered by these centres can form the short-wavelength-to-optical-wavelength, incoherent-to-coherent basis of a Bragg X-ray microscope, with inherent scope for optical phasing. Depending on the dynamics of the medium chosen, the way is open to both ultrafast pulsed and integrating measurements. For experiments employing brief pulses, we discuss high-dynamic-range short-wavelength diffraction measurements with real-time optical reconstructions. Applications to optical real-time X-ray phase-retrieval are considered. Copyright © 2010 Elsevier B.V. All rights reserved.

Ion-induced nanopatterns on semiconductor surfaces investigated by grazing incidence x-ray scattering techniques

Energy Technology Data Exchange (ETDEWEB)

Carbone, D; Metzger, T H [ID01, ESRF, 6 rue Jules Horowitz, F-38043 Grenoble Cedex (France); Biermanns, A; Pietsch, U [Festkoerperphysik, Universitaet Siegen, D-57068 Siegen (Germany); Ziberi, B; Frost, F [Leibniz-Institut fuer Oberflaechenmodifizierung e.V., D-04318 Leipzig (Germany); Plantevin, O [Universite Paris-Sud, Centre de Spectrometrie Nucleaire et de Spectrometrie de Masse, UMR 8609, F-91405 Orsay (France)], E-mail: gcarbone@esrf.fr

2009-06-03

In this review we cover and describe the application of grazing incidence x-ray scattering techniques to study and characterize nanopattern formation on semiconductor surfaces by ion beam erosion under various conditions. It is demonstrated that x-rays under grazing incidence are especially well suited to characterize (sub)surface structures on the nanoscale with high spatial and statistical accuracy. The corresponding theory and data evaluation is described in the distorted wave Born approximation. Both ex situ and in situ studies are presented, performed with the use of a specially designed sputtering chamber which allows us to follow the temporal evolution of the nanostructure formation. Corresponding results show a general stabilization of the ordering wavelength and the extension of the ordering as a function of the ion energy and fluence as predicted by theory. The in situ measurements are especially suited to study the early stages of pattern formation, which in some cases reveal a transition from dot to ripple formation. For the case of medium energy ions crystalline ripples are formed buried under a semi-amorphous thick layer with a ripple structure at the surface being conformal with the crystalline/amorphous interface. Here, the x-ray techniques are especially advantageous since they are non-destructive and bulk-sensitive by their very nature. In addition, the GI x-ray techniques described in this review are a unique tool to study the evolving strain, a topic which remains to be explored both experimentally and theoretically.

Multiple scattering in grazing-incidence X-ray diffraction: impact on lattice-constant determination in thin films

Energy Technology Data Exchange (ETDEWEB)

Resel, Roland, E-mail: roland.resel@tugraz.at; Bainschab, Markus; Pichler, Alexander [Graz University of Technology, Graz (Austria); Dingemans, Theo [Delft University of Technology, Delft (Netherlands); Simbrunner, Clemens [Johannes Kepler University, Linz (Austria); University of Bremen, Bremen (Germany); Stangl, Julian [Johannes Kepler University, Linz (Austria); Salzmann, Ingo [Humboldt University, Berlin (Germany)

2016-04-20

The use of grazing-incidence X-ray diffraction to determine the crystal structure from thin films requires accurate positions of Bragg peaks. Refraction effects and multiple scattering events have to be corrected or minimized. Dynamical scattering effects are observed in grazing-incidence X-ray diffraction experiments using an organic thin film of 2,2′:6′,2′′-ternaphthalene grown on oxidized silicon as substrate. Here, a splitting of all Bragg peaks in the out-of-plane direction (z-direction) has been observed, the magnitude of which depends both on the incidence angle of the primary beam and the out-of-plane angle of the scattered beam. The incident angle was varied between 0.09° and 0.25° for synchrotron radiation of 10.5 keV. This study reveals comparable intensities of the split peaks with a maximum for incidence angles close to the critical angle of total external reflection of the substrate. This observation is rationalized by two different scattering pathways resulting in diffraction peaks at different positions at the detector. In order to minimize the splitting, the data suggest either using incident angles well below the critical angle of total reflection or angles well above, which sufficiently attenuates the contributions from the second scattering path. This study highlights that the refraction of X-rays in (organic) thin films has to be corrected accordingly to allow for the determination of peak positions with sufficient accuracy. Based thereon, a reliable determination of the lattice constants becomes feasible, which is required for crystallographic structure solutions from thin films.

Laser plasma soft x-ray microscope with Wolter mirrors for observation of biological specimens in air

International Nuclear Information System (INIS)

Hoshino, Masato; Aoki, Sadao

2006-01-01

A laser plasma soft X-ray microscope with Wolter mirrors was developed so that specimens could be set in the atmosphere. Silicon nitride membranes 100 nm thick were used as vacuum-tight windows. Using relatively large windows (0.46 x 0.46 mm 2 ), an adequate working distance for samples, which was approximately 1.2 mm, was assured. The endrance of the vacuum-tight window was measured briefly. Dry biological cells could be observed with resolution better than 100 nm. A preliminary observation of wet biological cells was carried out using a wet environmental sample holder which was composed of only two sheets of silicon nitride membrane. An X-ray micrograph of wet red blood cells from a chicken was obtained without apparent effects of radiation damage. The properties of a vacuum-tight window and a wet sample holder are discussed. (author)

X-ray microscopy and spectromicroscopy - tools for environmental studies

International Nuclear Information System (INIS)

Thieme, J.

2002-01-01

Full text: X-ray microscopy achieves a much higher resolution than light microscopy. This is due to the much shorter wavelength of X-rays compared to visible light. The smallest structures that can be seen in an X-ray microscope at present are about 20 nm in size. X-ray microscopy is also capable of imaging specimens directly in aqueous media. By choosing the wavelength of the X-radiation appropriately, it is possible to perform spectromicroscopy studies. Comprising, it is a tool very well suited to study colloidal structures in the environment. X-ray microscopy can be performed with two types of instruments. An X-ray microscope quickly takes high-resolution images of objects to be studied, whereas a scanning X-ray microscope is an analytical instrument for spectromicroscopy. Here, an object can be imaged using energies above and below the absorption edge of an element. Dividing both images gives rise to a map of the distribution of this element in the sample. Using near-edge resonances it is possible to conduct NEXAFS studies. As the X-ray energy is raised to match the absorption edge resonances are found, that reflect the chemical bonding state of the element. Therefore, it is possible with X-ray microscopy to combine high spatial resolution with high spectral resolution for studies of colloidal structures. The Institute of X-ray physics builds up an X-ray microscopy beamline at the electron storage ring BESSY II with both, an X-ray microscope and a scanning X-ray microscope. The status of this beamline will be presented in this talk. Colloidal structures play an important role in the environment. Due to their surface activity they are involved in various processes. Substances can be bound and immobilized or transported, colloids can attach to microorganisms building up microhabitats, and organic substances as humics can flocculate due the interaction with metals. A great variety of colloidal structures from the environment have been studied using X-ray

Grazing exit versus grazing incidence geometry for x-ray absorption near edge structure analysis of arsenic traces

International Nuclear Information System (INIS)

Meirer, F.; Streli, C.; Wobrauschek, P.; Zoeger, N.; Pepponi, G.

2009-01-01

In the presented study the grazing exit x-ray fluorescence was tested for its applicability to x-ray absorption near edge structure analysis of arsenic in droplet samples. The experimental results have been compared to the findings of former analyses of the same samples using a grazing incidence (GI) setup to compare the performance of both geometries. Furthermore, the investigations were accomplished to gain a better understanding of the so called self-absorption effect, which was observed and investigated in previous studies using a GI geometry. It was suggested that a normal incidence-grazing-exit geometry would not suffer from self-absorption effects in x-ray absorption fine structure (XAFS) analysis due to the minimized path length of the incident beam through the sample. The results proved this assumption and in turn confirmed the occurrence of the self-absorption effect for GI geometry. Due to its lower sensitivity it is difficult to apply the GE geometry to XAFS analysis of trace amounts (few nanograms) of samples but the technique is well suited for the analysis of small amounts of concentrated samples

High-energy x-ray microscopy with multilayer reflectors (invited)

International Nuclear Information System (INIS)

Underwood, J.H.

1986-01-01

A knowledge of the spatial distribution of the x rays emitted by the hot plasma region is a key element in the study of the physical processes occurring in laser-produced plasmas and complements other diagnostics such as spectroscopy and temporal studies. X-ray microscopy with reflection microscopes offers the most direct means of obtaining this information. Until recently, the two types of microscopes that had been developed for this purpose, the Kirkpatrick--Baez and the Wolter, operated at relatively low energies (about 4--5 keV) and had very little spectral selectivity, relying on filters for coarse spectral resolution. With the development of x-ray reflecting multilayer mirrors, the energy response of such microscopes can be extended to 10 keV or higher, with good spectral selectivity. In addition, it is possible to reduce some of the optical aberrations to obtain improved spatial resolution. This paper describes some of the recent progress in making and evaluating x-ray reflectors, and outlines the optical design considerations for multilayer-coated microscopes. Results from a prototype multilayer K--B microscope are presented

Novel micro-reactor flow cell for investigation of model catalysts using in situ grazing-incidence X-ray scattering

DEFF Research Database (Denmark)

Kehres, Jan; Pedersen, Thomas; Masini, Federico

2016-01-01

at synchrotron facilities are performed utilizing the micro-reactor and a designed transportable gas feed and analysis system. The feasibility of simultaneous in situ GISAXS/GIWAXS experiments in the novel micro-reactor flow cell was confirmed with CO oxidation over mass-selected Ru nanoparticles.......The design, fabrication and performance of a novel and highly sensitive micro-reactor device for performing in situ grazing-incidence X-ray scattering experiments of model catalyst systems is presented. The design of the reaction chamber, etched in silicon on insulator (SIO), permits grazing......-incidence small-angle X-ray scattering (GISAXS) in transmission through 10 µm-thick entrance and exit windows by using micro-focused beams. An additional thinning of the Pyrex glass reactor lid allows simultaneous acquisition of the grazing-incidence wide-angle X-ray scattering (GIWAXS). In situ experiments...

Novel micro-reactor flow cell for investigation of model catalysts using in situ grazing-incidence X-ray scattering

Science.gov (United States)

Kehres, Jan; Pedersen, Thomas; Masini, Federico; Andreasen, Jens Wenzel; Nielsen, Martin Meedom; Diaz, Ana; Nielsen, Jane Hvolbæk; Hansen, Ole

2016-01-01

The design, fabrication and performance of a novel and highly sensitive micro-reactor device for performing in situ grazing-incidence X-ray scattering experiments of model catalyst systems is presented. The design of the reaction chamber, etched in silicon on insulator (SIO), permits grazing-incidence small-angle X-ray scattering (GISAXS) in transmission through 10 µm-thick entrance and exit windows by using micro-focused beams. An additional thinning of the Pyrex glass reactor lid allows simultaneous acquisition of the grazing-incidence wide-angle X-ray scattering (GIWAXS). In situ experiments at synchrotron facilities are performed utilizing the micro-reactor and a designed transportable gas feed and analysis system. The feasibility of simultaneous in situ GISAXS/GIWAXS experiments in the novel micro-reactor flow cell was confirmed with CO oxidation over mass-selected Ru nanoparticles. PMID:26917133

Soft x-ray lasers

International Nuclear Information System (INIS)

Matthews, D.L.; Rosen, M.D.

1988-01-01

One of the elusive dreams of laser physicists has been the development of an x-ray laser. After 25 years of waiting, the x-ray laser has at last entered the scientific scene, although those now in operation are still laboratory prototypes. They produce soft x rays down to about five nanometers. X-ray lasers retain the usual characteristics of their optical counterparts: a very tight beam, spatial and temporal coherence, and extreme brightness. Present x-ray lasers are nearly 100 times brighter that the next most powerful x-ray source in the world: the electron synchrotron. Although Lawrence Livermore National Laboratory (LLNL) is widely known for its hard-x-ray laser program which has potential applications in the Strategic Defense Initiative, the soft x-ray lasers have no direct military applications. These lasers, and the scientific tools that result from their development, may one day have a place in the design and diagnosis of both laser fusion and hard x-ray lasers. The soft x-ray lasers now in operation at the LLNL have shown great promise but are still in the primitive state. Once x-ray lasers become reliable, efficient, and economical, they will have several important applications. Chief among them might be the creation of holograms of microscopic biological structures too small to be investigated with visible light. 5 figs

Hard x-ray phase contrastmicroscopy - techniques and applications

Science.gov (United States)

Holzner, Christian

In 1918, Einstein provided the first description of the nature of the refractive index for X-rays, showing that phase contrast effects are significant. A century later, most x-ray microscopy and nearly all medical imaging remains based on absorption contrast, even though phase contrast offers orders of magnitude improvements in contrast and reduced radiation exposure at multi-keV x-ray energies. The work presented is concerned with developing practical and quantitative methods of phase contrast for x-ray microscopy. A theoretical framework for imaging in phase contrast is put forward; this is used to obtain quantitative images in a scanning microscope using a segmented detector, and to correct for artifacts in a commercial phase contrast x-ray nano-tomography system. The principle of reciprocity between scanning and full-field microscopes is then used to arrive at a novel solution: Zernike contrast in a scanning microscope. These approaches are compared on a theoretical and experimental basis in direct connection with applications using multi-keV x-ray microscopes at the Advanced Photon Source at Argonne National Laboratory. Phase contrast provides the best means to image mass and ultrastructure of light elements that mainly constitute biological matter, while stimulated x-ray fluorescence provides high sensitivity for studies of the distribution of heavier trace elements, such as metals. These approaches are combined in a complementary way to yield quantitative maps of elemental concentration from 2D images, with elements placed in their ultrastructural context. The combination of x-ray fluorescence and phase contrast poses an ideal match for routine, high resolution tomographic imaging of biological samples in the future. The presented techniques and demonstration experiments will help pave the way for this development.

X-ray and scanning electron microscopic investigation of porous silicon and silicon epitaxial layers grown on porous silicon

International Nuclear Information System (INIS)

Wierzchowski, W.; Pawlowska, M.; Nossarzewska-Orlowska, E.; Brzozowski, A.; Wieteska, K.; Graeff, W.

1998-01-01

The 1 to 5 μm thick layers of porous silicon and epitaxial layers grown on porous silicon were studied by means of X-ray diffraction methods, realised with a wide use of synchrotron source and scanning microscopy. The results of x-ray investigation pointed the difference of lateral periodicity between the porous layer and the substrate. It was also found that the deposition of epitaxial layer considerably reduced the coherence of porous fragments. A number of interface phenomena was also observed in section and plane wave topographs. The scanning electron microscopic investigation of cleavage faces enabled direct evaluation of porous layer thickness and revealed some details of their morphology. The scanning observation of etched surfaces of epitaxial layers deposited on porous silicon revealed dislocations and other defects not reasonable in the X-ray topographs. (author)

Nanostructured diffractive optical devices for soft X-ray microscopes

CERN Document Server

Hambach, D; Schneider, G

2001-01-01

The new transmission X-ray microscope (TXM) installed at the BESSY II electron storage ring uses an off-axis transmission zone plate (OTZ) as diffractive and focusing element of the condenser-monochromator setup. A high resolution micro-zone plate (MZP) forms a magnified image on a CCD-detector. Both, the OTZ with an active area of up to 24 mm sup 2 and the MZP with zone widths as small as 25 nm are generated by a process including electron beam lithography (EBL), dry etching and subsequent electroplating of nickel on top of silicon membrane substrates with about 100-150 nm thickness. The combination of a larger zone width and the usage of nickel zone structures allows to increase the diffraction efficiency of the condenser element at least by a factor of 3 compared to the earlier used KZP7 condenser zone plate in the TXM at BESSY I. Groove diffraction efficiencies of 21.6% and 14.7% were measured for MZP objectives with 40 and 25 nm outermost zone width, respectively.

Determination of x-ray spectra incident on and transmitted through whole excised breast for improved mammographic exposing technique

International Nuclear Information System (INIS)

Haus, A.G.; Metz, C.E.; Doi, K.; Bernstein, J.

1976-01-01

Measurements were made of x-ray spectra incident on and transmitted through whole excised fresh breast tissue. The spectra and corresponding radiographs show that hardening of the x-ray beam from a molybdenum anode x-ray tube by a 0.5 mm Al filter instead of the conventional 0.03 mm Mo filter allows shorter exposure times and reduces patient radiation exposure. With the Al filter, acceptable image contrast is preserved in mammography of thick or dense breasts

The X-ray microscopy beamline UE46-PGM2 at BESSY

International Nuclear Information System (INIS)

Follath, R.; Schmidt, J. S.; Weigand, M.; Fauth, K.

2010-01-01

The Max Planck Institute for Metal Physics in Stuttgart and the Helmholtz Center Berlin operate a soft X-ray microscopy beamline at the storage ring BESSY II. A collimated PGM serves as monochromator for a scanning X-ray microscope and a full field X-ray microscope at the helical undulator UE46. The selection between both instruments is accomplished via two switchable focusing mirrors. The scanning microscope (SM) is based on the ALS STXM microscope and fabricated by the ACCEL company. The full field microscope (FFM) is currently in operation at the U41-SGM beamline and will be relocated to its final location this year.

Contact microscopy with a soft x-ray laser

International Nuclear Information System (INIS)

DiCicco, D.S.; Kim, D.; Rosser, R.J.; Skinner, C.H.; Suckewer, S.; Gupta, A.P.; Hirschberg, J.G.

1989-03-01

A soft x-ray laser of output energy 1-3 mJ at 19.2 nm has been used to record high resolution images of biological specimens. The contact images were recorded on photoresist which was later viewed in a scanning electron microscope. We also present a Composite Optical X- ray Laser Microscope ''COXRALM'' of novel design. 14 refs., 8 figs., 1 tab

Development of confocal X-ray fluorescence (XRF) microscopy at the Cornell high energy synchrotron source

International Nuclear Information System (INIS)

Woll, A.R.; Huang, R.; Mass, J.; Bisulca, C.; Bilderback, D.H.; Gruner, S.; Gao, N.

2006-01-01

A confocal X-ray fluorescence microscope was built at the Cornell High Energy Synchrotron Source (CHESS) to obtain compositional depth profiles of historic paintings. The microscope consists of a single-bounce, borosilicate monocapillary optic to focus the incident beam onto the painting and a commercial borosilicate polycapillary lens to collect the fluorescent X-rays. The resolution of the microscope was measured by scanning a variety of thin metal films through this confocal volume while monitoring the fluorescence signal. The capabilities of the technique were then probed using test paint microstructures with up to four distinct layers, each having a thickness in the range of 10-80 microns. Results from confocal XRF were compared with those from stand-alone XRF and visible light microscopy of the paint cross-sections. A large area, high-resolution scanner is currently being built to perform 3D scans on moderately sized paintings. (orig.)

First combined total reflection X-ray fluorescence and grazing incidence X-ray absorption spectroscopy characterization of aeolian dust archived in Antarctica and Alpine deep ice cores

Energy Technology Data Exchange (ETDEWEB)

Cibin, G. [Diamond Light Source, Harwell Science and Innovation Campus, Didcot, Oxon OX110DE (United Kingdom); IMONT/EIM, Ente Italiano della Montagna, P.za dei Caprettari 70, 00176 Roma (Italy); Universita' degli Studi di Roma Tre, Dipartimento di Scienze Geologiche, L.go S. Leonardo Murialdo 1, 00146 Roma (Italy)], E-mail: giannantonio.cibin@diamond.ac.uk; Marcelli, A. [INFN - Laboratori Nazionali di Frascati, P.O. Box 13, 00044 Frascati (Roma) (Italy); Maggi, V. [Universita degli Studi di Milano-Bicocca, Dipartimento di Scienze dell' Ambiente e del Territorio, Piazza della Scienza 1, 20126 Milano (Italy); Sala, M. [Universita degli Studi di Milano-Bicocca, Dipartimento di Scienze dell' Ambiente e del Territorio, Piazza della Scienza 1, 20126 Milano (Italy); Universita degli Studi di Milano, Dipartimento di Scienze della Terra ' A. Desio' , Sez. Mineralogia, Via Mangiagalli 34, 20133 Milano (Italy); Marino, F.; Delmonte, B. [Universita degli Studi di Milano-Bicocca, Dipartimento di Scienze dell' Ambiente e del Territorio, Piazza della Scienza 1, 20126 Milano (Italy); Albani, S. [Universita degli Studi di Milano-Bicocca, Dipartimento di Scienze dell' Ambiente e del Territorio, Piazza della Scienza 1, 20126 Milano (Italy); Universita degli Studi di Siena, Dottorato in Scienze Polari, via Laterina 8, 53100 Siena (Italy); Pignotti, S. [IMONT/EIM, Ente Italiano della Montagna, P.za dei Caprettari 70, 00176 Roma (Italy)

2008-12-15

Aeolian mineral dust archived in polar and mid latitude ice cores represents a precious proxy for assessing environmental and climatic variations at different timescales. In this respect, the identification of dust mineralogy plays a key role. In this work we performed the first preliminary X-ray absorption spectroscopy (XAS) experiments on mineral dust particles extracted from Antarctic and from Alpine firn cores using grazing incidence geometry at the Fe K-edge. A dedicated high vacuum experimental chamber was set up for normal-incidence and total-reflection X-Ray Fluorescence and Absorption Spectroscopy analyses on minor amounts of mineral materials at the Stanford Synchrotron Radiation Laboratory. Results show that this experimental technique and protocol allows recognizing iron inclusion mineral fraction on insoluble dust in the 1-10 {mu}g range.

First combined total reflection X-ray fluorescence and grazing incidence X-ray absorption spectroscopy characterization of aeolian dust archived in Antarctica and Alpine deep ice cores

International Nuclear Information System (INIS)

Cibin, G.; Marcelli, A.; Maggi, V.; Sala, M.; Marino, F.; Delmonte, B.; Albani, S.; Pignotti, S.

2008-01-01

Aeolian mineral dust archived in polar and mid latitude ice cores represents a precious proxy for assessing environmental and climatic variations at different timescales. In this respect, the identification of dust mineralogy plays a key role. In this work we performed the first preliminary X-ray absorption spectroscopy (XAS) experiments on mineral dust particles extracted from Antarctic and from Alpine firn cores using grazing incidence geometry at the Fe K-edge. A dedicated high vacuum experimental chamber was set up for normal-incidence and total-reflection X-Ray Fluorescence and Absorption Spectroscopy analyses on minor amounts of mineral materials at the Stanford Synchrotron Radiation Laboratory. Results show that this experimental technique and protocol allows recognizing iron inclusion mineral fraction on insoluble dust in the 1-10 μg range

Kaolinite flocculation induced by smectite addition - a transmission X-ray microscopic study.

Science.gov (United States)

Zbik, Marek S; Song, Yen-Fang; Frost, Ray L

2010-09-01

The influence of smectite addition on kaolinite suspensions in water was investigated by transmission X-ray microscopy (TXM) and Scanning Electron Microscopy (SEM). Sedimentation test screening was also conducted. Micrographs were processed by the STatistic IMage Analysing (STIMAN) program and structural parameters were calculated. From the results of the sedimentation tests important influences of small smectite additions to about 3wt.% on kaolinite suspension flocculation has been found. In order to determine the reason for this smectite impact on kaolinite suspension, macroscopic behaviour micro-structural examination using Transmission X-ray Microscope (TXM) and SEM has been undertaken. TXM & SEM micrographs of freeze-dried kaolinite-smectite suspensions with up to 20% smectite showed a high degree of orientation of the fabric made of highly oriented particles and greatest density when 3wt.% of smectite was added to the 10wt.% dense kaolinite suspension. In contrast, suspensions containing pure kaolinite do not show such platelet mutual orientation but homogenous network of randomly oriented kaolinite platelets. This suggests that in kaolinite-smectite suspensions, smectite forms highly oriented basic framework into which kaolinite platelets may bond in face to face preferential contacts strengthening structure and allowing them to show plastic behaviour which is cause of platelets orientation. Copyright 2010 Elsevier Inc. All rights reserved.

Grazing incidence X-ray fluorescence analysis of buried interfaces in periodically structured crystalline silicon thin-film solar cells

Energy Technology Data Exchange (ETDEWEB)

Eisenhauer, David; Preidel, Veit; Becker, Christiane [Young Investigator Group Nanostructured Silicon for Photovoltaic and Photonic Implementations (Nano-SIPPE), Helmholtz-Zentrum Berlin fuer Materialien und Energie GmbH, Berlin (Germany); Pollakowski, Beatrix; Beckhoff, Burkhard [Physikalisch-Technische Bundesanstalt, Berlin (Germany); Baumann, Jonas; Kanngiesser, Birgit [Institut fuer Optik und Atomare Physik, Technische Universitaet Berlin (Germany); Amkreutz, Daniel; Rech, Bernd [Institut Silizium Photovoltaik, Helmholtz-Zentrum Berlin fuer Materialien und Energie GmbH, Berlin (Germany); Back, Franziska; Rudigier-Voigt, Eveline [SCHOTT AG, Mainz (Germany)

2015-03-01

We present grazing incidence X-ray fluorescence (GIXRF) experiments on 3D periodically textured interfaces of liquid phase crystallized silicon thin-film solar cells on glass. The influence of functional layers (SiO{sub x} or SiO{sub x}/SiC{sub x}) - placed between glass substrate and silicon during crystallization - on the final carbon and oxygen contaminations inside the silicon was analyzed. Baring of the buried structured silicon surface prior to GIXRF measurement was achieved by removal of the original nano-imprinted glass substrate by wet-chemical etching. A broad angle of incidence distribution was determined for the X-ray radiation impinging on this textured surface. Optical simulations were performed in order to estimate the incident radiation intensity on the structured surface profile considering total reflection and attenuation effects. The results indicate a much lower contamination level for SiO{sub x} compared to the SiO{sub x}/SiC{sub x} interlayers, and about 25% increased contamination when comparing structured with planar silicon layers, both correlating with the corresponding solar cell performances. (copyright 2015 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim)

Los Alamos Scientific Laboratory x-ray survey manual

International Nuclear Information System (INIS)

Olsher, R.H.

1980-02-01

A manual has been developed by the Health Physics Group to establish procedures for routine testing of industrial and analytical x-ray equipment for compliance with applicable LASL administrative requirements and technical bulletins. Radiation protection survey procedures were developed for the following types of equipment: x-ray diffraction and fluorescence analysis systems, industrial cabinet x-ray systems, industrial noncabinet x-ray systems, and electron microscopes

Test facility for astronomical x-ray optics

DEFF Research Database (Denmark)

Christensen, Finn Erland; Lewis, Robert A.; Bordas, J.

1990-01-01

Grazing incidence x-ray optics for x-ray astronomical applications are used outside the earth's atmosphere. These devices require a large collection aperture and the imaging of an x-ray source that is essentially placed at infinity. The ideal testing system for these optical elements has to appro......Grazing incidence x-ray optics for x-ray astronomical applications are used outside the earth's atmosphere. These devices require a large collection aperture and the imaging of an x-ray source that is essentially placed at infinity. The ideal testing system for these optical elements has...... to approximate that encountered under working conditions; however, the testing of these optical elements is notoriously difficult with conventional x-ray generators. Synchrotron radiation (SR) sources are sufficiently brilliant to produce a nearly perfect parallel beam over a large area while still retaining...... a flux considerably higher than that available from conventional x-ray generators. A facility designed for the testing of x-ray optics, particularly in connection with x-ray telescopes, is described. It is proposed that this facility will be accommodated at the Synchrotron Radiation Source...

Femtosecond X-ray magnetic circular dichroism absorption spectroscopy at an X-ray free electron laser

Energy Technology Data Exchange (ETDEWEB)

Higley, Daniel J., E-mail: dhigley@stanford.edu; Yuan, Edwin [SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, California 94025 (United States); Department of Applied Physics, Stanford University, Stanford, California 94305 (United States); Hirsch, Konstantin; Dakovski, Georgi L.; Jal, Emmanuelle; Lutman, Alberto A.; Coslovich, Giacomo; Hart, Philip; Hoffmann, Matthias C.; Mitra, Ankush; Moeller, Stefan; Ohldag, Hendrik; Seaberg, Matthew; Stöhr, Joachim; Nuhn, Heinz-Dieter; Reid, Alex H.; Dürr, Hermann A.; Schlotter, William F. [SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, California 94025 (United States); Liu, Tianmin; MacArthur, James P. [SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, California 94025 (United States); Department of Physics, Stanford University, Stanford, California 94305 (United States); and others

2016-03-15

X-ray magnetic circular dichroism spectroscopy using an X-ray free electron laser is demonstrated with spectra over the Fe L{sub 3,2}-edges. The high brightness of the X-ray free electron laser combined with high accuracy detection of incident and transmitted X-rays enables ultrafast X-ray magnetic circular dichroism studies of unprecedented sensitivity. This new capability is applied to a study of all-optical magnetic switching dynamics of Fe and Gd magnetic sublattices in a GdFeCo thin film above its magnetization compensation temperature.

Confocal total reflection X-ray fluorescence technology based on an elliptical monocapillary and a parallel polycapillary X-ray optics.

Science.gov (United States)

Zhu, Yu; Wang, Yabing; Sun, Tianxi; Sun, Xuepeng; Zhang, Xiaoyun; Liu, Zhiguo; Li, Yufei; Zhang, Fengshou

2018-07-01

A total reflection X-ray fluorescence (TXRF) spectrometer based on an elliptical monocapillary X-ray lens (MXRL) and a parallel polycapillary X-ray lens (PPXRL) was designed. This TXRF instrument has micro focal spot, low divergence and high intensity of incident X-ray beam. The diameter of the focal spot of MXRL was 16.5 µm, and the divergence of the incident X-ray beam was 3.4 mrad. We applied this TXRF instrument to the micro analysis of a single-layer film containing Ni deposited on a Si substrate by metal vapor vacuum arc ion source. Copyright © 2018 Elsevier Ltd. All rights reserved.

Subpicosecond Coherent Manipulation of X-Rays

International Nuclear Information System (INIS)

Adams, Bernhard W.

2004-01-01

The Takagi-Taupin theory is synthesized with the eikonal theory in a unified space-time approach, based upon microscopic electromagnetism. It is designed specifically to address x-ray diffraction in crystal structures being modified within down to a few femtosconds. Possible applications in the subpicosecond coherent manipulation of x-rays are given

Laser Plasma Soft X-ray Microscope with Wolter Mirrors for Observation of Biological Specimens in Air

Science.gov (United States)

Hoshino, Masato; Aoki, Sadao

2006-02-01

A laser plasma soft X-ray microscope with Wolter mirrors was developed so that specimens could be set in the atmosphere. Silicon nitride membranes 100 nm thick were used as vacuum-tight windows. Using relatively large windows (0.46× 0.46 mm2), an adequate working distance for samples, which was approximately 1.2 mm, was assured. The endurance of the vacuum-tight window was measured briefly. Dry biological cells could be observed with resolution better than 100 nm. A preliminary observation of wet biological cells was carried out using a wet environmental sample holder which was composed of only two sheets of silicon nitride membrane. An X-ray micrograph of wet red blood cells from a chicken was obtained without apparent effects of radiation damage. The properties of a vacuum-tight window and a wet sample holder are discussed.

Flash x-ray

International Nuclear Information System (INIS)

Johnson, Q.; Pellinen, D.

1976-01-01

The complementary techniques of flash x-ray radiography (FXR) and flash x-ray diffraction (FXD) provide access to a unique domain in nondestructive materials testing. FXR is useful in studies of macroscopic properties during extremely short time intervals, and FXD, the newer technique, is used in studies of microscopic properties. Although these techniques are similar in many respects, there are some substantial differences. FXD generally requires low-voltage, line-radiation sources and extremely accurate timing; FXR is usually less demanding. Phenomena which can be profitably studied by FXR often can also be studied by FXD to permit a complete materials characterization

Progress in high-resolution x-ray holographic microscopy

International Nuclear Information System (INIS)

Jacobsen, C.; Kirz, J.; Howells, M.; McQuaid, K.; Rothman, S.; Feder, R.; Sayre, D.

1987-07-01

Among the various types of x-ray microscopes that have been demonstrated, the holographic microscope has had the largest gap between promise and performance. The difficulties of fabricating x-ray optical elements have led some to view holography as the most attractive method for obtaining the ultimate in high resolution x-ray micrographs; however, we know of no investigations prior to 1987 that clearly demonstrated submicron resolution in reconstructed images. Previous efforts suffered from problems such as limited resolution and dynamic range in the recording media, low coherent x-ray flux, and aberrations and diffraction limits in visible light reconstruction. We have addressed the recording limitations through the use of an undulator x-ray source and high-resolution photoresist recording media. For improved results in the readout and reconstruction steps, we have employed metal shadowing and transmission electron microscopy, along with numerical reconstruction techniques. We believe that this approach will allow holography to emerge as a practical method of high-resolution x-ray microscopy. 30 refs., 4 figs

Progress in high-resolution x-ray holographic microscopy

Energy Technology Data Exchange (ETDEWEB)

Jacobsen, C.; Kirz, J.; Howells, M.; McQuaid, K.; Rothman, S.; Feder, R.; Sayre, D.

1987-07-01

Among the various types of x-ray microscopes that have been demonstrated, the holographic microscope has had the largest gap between promise and performance. The difficulties of fabricating x-ray optical elements have led some to view holography as the most attractive method for obtaining the ultimate in high resolution x-ray micrographs; however, we know of no investigations prior to 1987 that clearly demonstrated submicron resolution in reconstructed images. Previous efforts suffered from problems such as limited resolution and dynamic range in the recording media, low coherent x-ray flux, and aberrations and diffraction limits in visible light reconstruction. We have addressed the recording limitations through the use of an undulator x-ray source and high-resolution photoresist recording media. For improved results in the readout and reconstruction steps, we have employed metal shadowing and transmission electron microscopy, along with numerical reconstruction techniques. We believe that this approach will allow holography to emerge as a practical method of high-resolution x-ray microscopy. 30 refs., 4 figs.

A development of laser-plasma-based soft x-ray microscope system

International Nuclear Information System (INIS)

Nam, Ki Yong; Kim, Kyong Woo; Kim, Kyu Gyeom; Kwon, Young Man; Yoon, Kwon Ha

2003-01-01

Soft x-ray nano-imaging microscopy system for biomedical application with a high resolution about 50 nm has been designed and described, and its integrated techniques also have been studied. The system is mainly composed of soft x-ray generation system, nano-scaled control system, x-ray optical device like a condenser or object mirror, a CCD camera coupled with multichannel plate (MCP) and vacuum system. In the system, soft x-ray is generated from the laser-based plasma by focusing Nd:YAG laser beam on tantalum (Ta) target. In an x-ray optical system, a wolter mirror has been considering condensing the x-ray beam on a biological specimen and zone plate was adapted as an object mirror. A Si 3 N 4 was used as specimen holder for keeping a biological sample alive in atmosphere conditions. A back-illuminated-CCD camera coupled with multichannel plate was determined to set up.

A development of laser-plasma-based soft x-ray microscope system

Energy Technology Data Exchange (ETDEWEB)

Nam, Ki Yong; Kim, Kyong Woo; Kim, Kyu Gyeom; Kwon, Young Man; Yoon, Kwon Ha [X-ray Microscopy Research Center, Wonkwang University, Iksan (Korea, Republic of)

2003-07-01

Soft x-ray nano-imaging microscopy system for biomedical application with a high resolution about 50 nm has been designed and described, and its integrated techniques also have been studied. The system is mainly composed of soft x-ray generation system, nano-scaled control system, x-ray optical device like a condenser or object mirror, a CCD camera coupled with multichannel plate (MCP) and vacuum system. In the system, soft x-ray is generated from the laser-based plasma by focusing Nd:YAG laser beam on tantalum (Ta) target. In an x-ray optical system, a wolter mirror has been considering condensing the x-ray beam on a biological specimen and zone plate was adapted as an object mirror. A Si{sub 3}N{sub 4} was used as specimen holder for keeping a biological sample alive in atmosphere conditions. A back-illuminated-CCD camera coupled with multichannel plate was determined to set up.

SECCOX, a novel x-ray characterization bench for Bragg crystals and x-rays optics

International Nuclear Information System (INIS)

Caillaud, T.; Manson, M.; Desenne, D.; Goze, B.; Rivet, A.; Derouineau, Ph.

2007-01-01

Laser programs require the use of a large number of calibrated x-ray crystals implemented inside spectrometers and microscopes used in diagnostics. In this context, a new apparatus was designed in collaboration with CELIA laboratory, Saint-Gobain Crystals and Detectors and CEA to characterize x-ray Bragg crystals. Station d'Etude et de Caracterisation des Cristaux pour les Optiques X (SECCOX) is based on a micrometric x-ray source and an automated spectrometer equipped with a CCD camera. Properties such as homogeneity, resolution, radius of curvature and reflectivity are measured to guarantee diagnostic performance in laser-plasma physics experiments. We will present the experimental device, techniques and results of the calibration obtained. (authors)

Soft X-ray images of the solar corona using normal incidence optics

Science.gov (United States)

Bruner, M. E.; Haisch, B. M.; Brown, W. A.; Acton, L. W.; Underwood, J. H.

1988-01-01

A solar coronal loop system has been photographed in soft X-rays using a normal incidence telescope based on multilayer mirror technology. The telescope consisted of a spherical objective mirror of 4 cm aperture and 1 m focal length, a film cassette, and a focal plane shutter. A metallized thin plastic film filter was used to exclude visible light. The objective mirror was covered with a multilayer coating consisting of alternating layers of tungsten and carbon whose combined thicknesses satisfied the Bragg diffraction condition for 44 A radiation. The image was recorded during a rocket flight on October 25, 1985 and was dominated by emission lines arising from the Si XII spectrum. The rocket also carried a high resolution soft X-ray spectrograph that confirmed the presence of Si XII line radiation in the source. This image represents the first successful use of multilayer technology for astrophysical observations.

Micro-fresnel structures for microscopy of laser generated bright x-ray sources

International Nuclear Information System (INIS)

Ceglio, N.M.; Shavers, D.C.; Flanders, D.C.; Smith, H.I.

1979-01-01

A brief parametric survey of the x-ray characteristics of a gold micro-disk irradiated at 3 x 10 14 watt/cm 2 by a 1 nsec Nd-glass laser pulse has been provided as an example of a laser generated bright x-ray source. It was shown that a simple phenomenological model of the laser generated x-ray source as a microscopic equilibrium plasma radiating as a blackbody for a finite time determined by its hydrodynamic disassembly and radiation losses, serves to provide an adequate approximation to the x-ray characteristics of such sources. The current state of x-ray microscopy within the LLL laser fusion program was briefly reviewed. Kirpatrick--Baez grazing incidence reflection x-ray microscopes are being used to provide 3 to 5 μm resolution, broadband images (ΔE/E approx. 0.3) over a spectral range from .6 keV to 3.5 keV. Zone Plate Coded Imaging is used to provide 5 to 10 μm resolution, broadband (ΔE/E approx. 0.5) images over a spectral range from 3 keV to 50 keV. Efficient x-ray lensing elements with anticipated submicron resolution are being developed for narrowband (ΔE/E approx. 10 -2 ) imaging applications over a spectral range .1 keV to 8 keV. The x-ray lens design is that of a transmission blazed Fresnel phase plate. Micro--Fresnel zone plates with 3200 A minimum linewidth have been fabricated and preliminary resolution tests begun. The first resolution test pattern, having minimum linewidth of 2.5 μm, was imaged in lambda = 8.34 A light with no difficulty. Newer test patterns with submicron minimum line are being prepared for the next stage of resolution testing. An off-axis Fresnel zone plate with 1600 A minimum linewidth is presently being fabricated for use as an imaging spectrometer in order to provide spatially separated, chromatically distinct images of characteristic line emissions from laser fusion targets

Microscopic nonlinear relativistic quantum theory of absorption of powerful x-ray radiation in plasma.

Science.gov (United States)

Avetissian, H K; Ghazaryan, A G; Matevosyan, H H; Mkrtchian, G F

2015-10-01

The microscopic quantum theory of plasma nonlinear interaction with the coherent shortwave electromagnetic radiation of arbitrary intensity is developed. The Liouville-von Neumann equation for the density matrix is solved analytically considering a wave field exactly and a scattering potential of plasma ions as a perturbation. With the help of this solution we calculate the nonlinear inverse-bremsstrahlung absorption rate for a grand canonical ensemble of electrons. The latter is studied in Maxwellian, as well as in degenerate quantum plasma for x-ray lasers at superhigh intensities and it is shown that one can achieve the efficient absorption coefficient in these cases.

Wavelength dispersive X-ray absorption fine structure imaging by parametric X-ray radiation

International Nuclear Information System (INIS)

Inagaki, Manabu; Sakai, Takeshi; Sato, Isamu; Hayakawa, Yasushi; Nogami, Kyoko; Tanaka, Toshinari; Hayakawa, Ken; Nakao, Keisuke

2008-01-01

The parametric X-ray radiation (PXR) generator system at Laboratory for Electron Beam Research and Application (LEBRA) in Nihon University is a monochromatic and coherent X-ray source with horizontal wavelength dispersion. The energy definition of the X-rays, which depends on the horizontal size of the incident electron beam on the generator target crystal, has been investigated experimentally by measuring the X-ray absorption near edge structure (XANES) spectra on Cu and CuO associated with conventional X-ray absorption imaging technique. The result demonstrated the controllability of the spectrum resolution of XANES by adjusting of the horizontal electron beam size on the target crystal. The XANES spectra were obtained with energy resolution of several eV at the narrowest case, which is in qualitative agreement with the energy definition of the PXR X-rays evaluated from geometrical consideration. The result also suggested that the wavelength dispersive X-ray absorption fine structure measurement associated with imaging technique is one of the promising applications of PXR. (author)

Adjustable Grazing Incidence X-ray Optics with 0.5 Arc Second Resolution

Science.gov (United States)

Reid, Paul

We seek to develop adjustable grazing incidence optics for x-ray astronomy. The goal of this development is thin, lightweight mirrors with angular resolution of 0.5 arc seconds, comparable to the Chandra X-ray Observatory. The new mirror design consists of thin segments of a Wolter-I grazing incidence mirror, with piezo-electric material deposited directly on the back surface of the mirror. Depositing a pattern of independently addressable electrodes on top of the piezoelectric material produces an array of independent piezo cells. Energizing a particular cell introduces a localized deformation in the mirror without the need for a reaction structure. By applying the appropriate voltage to the piezo cells, it is possible to correct mirror figure errors that result from mirror fabrication, gravity release, mounting, and thermal effects. Because the thin mirrors segments are lightweight, they can be densely nested to produce collecting area thirty times that of Chandra, on an affordably priced mission. This Supporting Technology program is a follow-on to an existing APRA program. In the existing program we demonstrated the first successful deposition of piezoelectric material on thermally formed glass substrates. We showed that the localized deformations produced by the piezo cells match finite element predictions, and the piezo cell adjustment range meets requirements necessary to achieve the desired figure correction. We have also shown through simulation that representative mirror figure errors can be corrected via modeled influence functions to achieve 0.5 arc sec imaging performance. This provides a firm foundation on which to develop further the technology. We will continue to optimize the deposition of thin piezoelectric films onto thermally formed glass and electroplated metal mirror segments to improve yield and manufacturability. We will deposit piezoelectric material onto conical mirror segments and demonstrate figure correction in agreement with prediction

Advantages of intermediate X-ray energies in Zernike phase contrast X-ray microscopy.

Science.gov (United States)

Wang, Zhili; Gao, Kun; Chen, Jian; Hong, Youli; Ge, Xin; Wang, Dajiang; Pan, Zhiyun; Zhu, Peiping; Yun, Wenbing; Jacobsen, Chris; Wu, Ziyu

2013-01-01

Understanding the hierarchical organizations of molecules and organelles within the interior of large eukaryotic cells is a challenge of fundamental interest in cell biology. Light microscopy is a powerful tool for observations of the dynamics of live cells, its resolution attainable is limited and insufficient. While electron microscopy can produce images with astonishing resolution and clarity of ultra-thin (3D images of cryo-preserved cells. The relatively low X-ray energy (3D imaging (e.g., ~1 μm DoF for 20 nm resolution). An X-ray microscope operating at intermediate energy around 2.5 keV using Zernike phase contrast can overcome the above limitations and reduces radiation dose to the specimen. Using a hydrated model cell with an average chemical composition reported in literature, we calculated the image contrast and the radiation dose for absorption and Zernike phase contrast, respectively. The results show that an X-ray microscope operating at ~2.5 keV using Zernike phase contrast offers substantial advantages in terms of specimen size, radiation dose and depth-of-focus. Copyright © 2012 Elsevier Inc. All rights reserved.

X-ray mosaic nanotomography of large microorganisms.

Science.gov (United States)

Mokso, R; Quaroni, L; Marone, F; Irvine, S; Vila-Comamala, J; Blanke, A; Stampanoni, M

2012-02-01

Full-field X-ray microscopy is a valuable tool for 3D observation of biological systems. In the soft X-ray domain organelles can be visualized in individual cells while hard X-ray microscopes excel in imaging of larger complex biological tissue. The field of view of these instruments is typically 10(3) times the spatial resolution. We exploit the assets of the hard X-ray sub-micrometer imaging and extend the standard approach by widening the effective field of view to match the size of the sample. We show that global tomography of biological systems exceeding several times the field of view is feasible also at the nanoscale with moderate radiation dose. We address the performance issues and limitations of the TOMCAT full-field microscope and more generally for Zernike phase contrast imaging. Two biologically relevant systems were investigated. The first being the largest known bacteria (Thiomargarita namibiensis), the second is a small myriapod species (Pauropoda sp.). Both examples illustrate the capacity of the unique, structured condenser based broad-band full-field microscope to access the 3D structural details of biological systems at the nanoscale while avoiding complicated sample preparation, or even keeping the sample environment close to the natural state. Copyright © 2012 Elsevier Inc. All rights reserved.

Determination of the Effective Detector Area of an Energy-Dispersive X-Ray Spectrometer at the Scanning Electron Microscope Using Experimental and Theoretical X-Ray Emission Yields.

Science.gov (United States)

Procop, Mathias; Hodoroaba, Vasile-Dan; Terborg, Ralf; Berger, Dirk

2016-12-01

A method is proposed to determine the effective detector area for energy-dispersive X-ray spectrometers (EDS). Nowadays, detectors are available for a wide range of nominal areas ranging from 10 up to 150 mm2. However, it remains in most cases unknown whether this nominal area coincides with the "net active sensor area" that should be given according to the related standard ISO 15632, or with any other area of the detector device. Moreover, the specific geometry of EDS installation may further reduce a given detector area. The proposed method can be applied to most scanning electron microscope/EDS configurations. The basic idea consists in a comparison of the measured count rate with the count rate resulting from known X-ray yields of copper, titanium, or silicon. The method was successfully tested on three detectors with known effective area and applied further to seven spectrometers from different manufacturers. In most cases the method gave an effective area smaller than the area given in the detector description.

X-ray grazing incidence study of inhomogeneous strain relaxation in Si/SiGe wires

International Nuclear Information System (INIS)

Hesse, A.; Zhuang, Y.; Holy, V.; Stangl, J.; Zerlauth, S.; Schaeffler, F.; Bauer, G.; Darowski, N.; Pietsch, U.

2003-01-01

The elastic strain relaxation in a series of dry-etched periodic multilayer Si/SiGe wire samples with different etching depths was investigated systematically by means of grazing incidence diffraction (GID). The samples were patterned by holographic lithography and reactive ion etching from a Si/SiGe superlattice grown by molecular beam epitaxy. Scanning electron microscopy and atomic force microscopy were employed to obtain information on the shape of the wires. The inhomogeneous strain distribution in the etched wires and in the non-etched part of the multilayers was derived by means of finite element calculations which were used as an input for simulations of the scattered X-ray intensities in depth dependent GID. The theoretical calculations for the scattered intensities are based on distorted-wave Born approximation. The unperturbed scattering potential was chosen with a reduced optical density corresponding to the ratio of wire width and wire period, in order to reflect the main interaction between the incident X-rays and the patterned samples. The calculations are in good agreement with the experimental data demonstrating the variation of strain relaxation with depth

Observation of Phase Objects by Using an X-ray Microscope with a Foucault Knife-Edge

Science.gov (United States)

Watanabe, N.; Sasaya, T.; Imai, Y.; Iwata, S.; Zama, K.; Aoki, S.

2011-09-01

An x-ray microscope with a zone plate was assembled at the synchrotron radiation source of BL3C, Photon Factory. A Foucault knife-edge was set at the back focal plate of the objective zone plate and phase retrieval was tested by scanning the knife-edge. A preliminary result shows that scanning the knife-edge during exposure was effective for phase retrieval. Phase-contrast tomography was investigated using differential projection images calculated from two Schlieren images with the oppositely oriented knife-edges. Fairly good reconstruction images of polystyrene beads and spores could be obtained.

Observation of Phase Objects by Using an X-ray Microscope with a Foucault Knife-Edge

International Nuclear Information System (INIS)

Watanabe, N.; Sasaya, T.; Imai, Y.; Iwata, S.; Zama, K.; Aoki, S.

2011-01-01

An x-ray microscope with a zone plate was assembled at the synchrotron radiation source of BL3C, Photon Factory. A Foucault knife-edge was set at the back focal plate of the objective zone plate and phase retrieval was tested by scanning the knife-edge. A preliminary result shows that scanning the knife-edge during exposure was effective for phase retrieval. Phase-contrast tomography was investigated using differential projection images calculated from two Schlieren images with the oppositely oriented knife-edges. Fairly good reconstruction images of polystyrene beads and spores could be obtained.

In situ x-ray reflectivity and grazing incidence x-ray diffraction study of L 1{sub 0} ordering in {sup 57}Fe/Pt multilayers

Energy Technology Data Exchange (ETDEWEB)

Raghavendra Reddy, V; Gupta, Ajay; Gome, Anil [UGC-DAE Consortium for Scientific Research, University Campus, Khandwa Road, Indore-452 017 (India); Leitenberger, Wolfram [Institute of Physics, University of Potsdam, 14469 Potsdam (Germany); Pietsch, U [Physics Department, University of Siegen, D-57068 Siegen (Germany)], E-mail: vrreddy@csr.ernet.in, E-mail: varimalla@yahoo.com

2009-05-06

In situ high temperature x-ray reflectivity and grazing incidence x-ray diffraction measurements in the energy dispersive mode are used to study the ordered face-centered tetragonal (fct) L 1{sub 0} phase formation in [Fe(19 A)/Pt(25 A)]{sub x 10} multilayers prepared by ion beam sputtering. With the in situ x-ray measurements it is observed that (i) the multilayer structure first transforms to a disordered FePt and subsequently to an ordered fct L 1{sub 0} phase, (ii) the ordered fct L 1{sub 0} FePt peaks start to appear at 320 deg. C annealing, (iii) the activation energy of the interdiffusion is 0.8 eV and (iv) ordered fct FePt grains have preferential out-of-plane texture. The magneto-optical Kerr effect and conversion electron Moessbauer spectroscopies are used to study the magnetic properties of the as-deposited and 400 deg. C annealed multilayers. The magnetic data for the 400 {sup 0}C annealed sample indicate that the magnetization is at an angle of {approx}50 deg. from the plane of the film.

The X-ray microscopy project at saga SLS

International Nuclear Information System (INIS)

Yasumoto, M.; Ishiguro, E.; Takemoto, K.; Kihara, H.; Kamijo, N.; Tomimasu, T.; Tsurushima, T.; Takahara, A.; Hara, K.; Chikaura, Y.

2002-01-01

A new high resolution X-ray microscopy project has been proposed at Saga synchrotron light source, which is a third generation synchrotron light facility in Japan. Two microscopy beamlines are planned for this project. One is a scanning microscope in the water window region, and the other is a full-field imaging microscope in the multi-keV X-ray energy region. To demonstrate the feasibility of the project, the optical layout of the scanning microscope was designed. The beamline mainly consists of a 3.5 cm periodical undulator, a varied line-spacing plane grating monochromator (600 lines/mm) and an end-station including a zone plate. Thus, the calculated X-ray properties focused on the sample position are as follows: the spot size is ∼ 70 nm, the monochromaticity is ∼2000, and the photon flux is 10 9 ∼ 10 10 photons/sec. (authors)

Binary pseudo-random patterned structures for modulation transfer function calibration and resolution characterization of a full-field transmission soft x-ray microscope

Energy Technology Data Exchange (ETDEWEB)

Yashchuk, V. V., E-mail: VVYashchuk@lbl.gov; Chan, E. R.; Lacey, I. [Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States); Fischer, P. J. [Center for X-Ray Optics, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States); Physics Department, University of California Santa Cruz, Santa Cruz, California 94056 (United States); Conley, R. [Advance Photon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States); National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, New York 11973 (United States); McKinney, W. R. [Diablo Valley College, 321 Golf Club Road, Pleasant Hill, California 94523 (United States); Artemiev, N. A. [KLA-Tencor Corp., 1 Technology Drive, Milpitas, California 95035 (United States); Bouet, N. [National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, New York 11973 (United States); Cabrini, S. [Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States); Calafiore, G.; Peroz, C.; Babin, S. [aBeam Technologies, Inc., Hayward, California 94541 (United States)

2015-12-15

We present a modulation transfer function (MTF) calibration method based on binary pseudo-random (BPR) one-dimensional sequences and two-dimensional arrays as an effective method for spectral characterization in the spatial frequency domain of a broad variety of metrology instrumentation, including interferometric microscopes, scatterometers, phase shifting Fizeau interferometers, scanning and transmission electron microscopes, and at this time, x-ray microscopes. The inherent power spectral density of BPR gratings and arrays, which has a deterministic white-noise-like character, allows a direct determination of the MTF with a uniform sensitivity over the entire spatial frequency range and field of view of an instrument. We demonstrate the MTF calibration and resolution characterization over the full field of a transmission soft x-ray microscope using a BPR multilayer (ML) test sample with 2.8 nm fundamental layer thickness. We show that beyond providing a direct measurement of the microscope’s MTF, tests with the BPRML sample can be used to fine tune the instrument’s focal distance. Our results confirm the universality of the method that makes it applicable to a large variety of metrology instrumentation with spatial wavelength bandwidths from a few nanometers to hundreds of millimeters.

Binary pseudo-random patterned structures for modulation transfer function calibration and resolution characterization of a full-field transmission soft x-ray microscope

International Nuclear Information System (INIS)

Yashchuk, V. V.; Chan, E. R.; Lacey, I.; Fischer, P. J.; Conley, R.; McKinney, W. R.; Artemiev, N. A.; Bouet, N.; Cabrini, S.; Calafiore, G.; Peroz, C.; Babin, S.

2015-01-01

We present a modulation transfer function (MTF) calibration method based on binary pseudo-random (BPR) one-dimensional sequences and two-dimensional arrays as an effective method for spectral characterization in the spatial frequency domain of a broad variety of metrology instrumentation, including interferometric microscopes, scatterometers, phase shifting Fizeau interferometers, scanning and transmission electron microscopes, and at this time, x-ray microscopes. The inherent power spectral density of BPR gratings and arrays, which has a deterministic white-noise-like character, allows a direct determination of the MTF with a uniform sensitivity over the entire spatial frequency range and field of view of an instrument. We demonstrate the MTF calibration and resolution characterization over the full field of a transmission soft x-ray microscope using a BPR multilayer (ML) test sample with 2.8 nm fundamental layer thickness. We show that beyond providing a direct measurement of the microscope’s MTF, tests with the BPRML sample can be used to fine tune the instrument’s focal distance. Our results confirm the universality of the method that makes it applicable to a large variety of metrology instrumentation with spatial wavelength bandwidths from a few nanometers to hundreds of millimeters

The effects of Pretreatment with stomach extract on the incidence of x-ray-induced gastric tumor in ICR mice

International Nuclear Information System (INIS)

Watanabe, Hiromitsu; Naito, Masashi; Kawashima, Kengo; Ito, Akihiro

1984-01-01

The effect of crude stomach extracts (CSE) on X-ray-induced gastric tumorigenesis was examined. ICR mice were treated with two or four administrations of CSE at one-week intervals then irradiated with 20 Gy of X-rays one week after the final CSE administration. Unexpectedly, the incidence of X-ray-induced tumors was not significantly altered by two CSE pretreatments but was markedly reduced by four CSE pretreatments. Similarly, erosion and squamous metaplasia produced in the glandular stomach a week after X-irradiation were markedly diminished by four CSE pretreatments but not by two CSE pretreatments. (author)

Response of the 'patient dose calibrator' chamber for incident positions and sizes of X-ray fields

International Nuclear Information System (INIS)

Oliveira, Cassio M.; Abrantes, Marcos Eugenio S.; Ferreira, Flavia C. Bastos; Lacerda, Marco A. de Souza; Alonso, Thessa C.; Silva, Teogenes A. da; Oliveira, Paulo Marcio C.

2009-01-01

The evaluation of patient doses is an important tool for optimizing radiodiagnostic medical procedures with conventional X-ray equipment and for improving the quality of the radiographic image. The Patient Dose Calibrator (PDC) chamber is a dosimetric instrument that is used in the evaluation of the air kerma-area product (P KA ) quantity aiming the reduction of patient doses. The objective this work was to study the P KA variation caused by different field incident positions and sizes of the X-ray beam on the PDC chamber. Results showed that the PDC chamber has repeatability lower than 0.6%, beam position dependence of 3% and linearity response within ± 6%; these characteristics are to be taken into account during evaluation of the radiological protection conditions of conventional x-ray equipment. (author)

Mechanical design of a precision linear flexural stage for 3D x-ray diffraction microscope at the Advanced Photon Source

Science.gov (United States)

Shu, D.; Liu, W.; Kearney, S.; Anton, J.; Tischler, J. Z.

2015-09-01

The 3-D X-ray diffraction microscope is a new nondestructive tool for the three-dimensional characterization of mesoscopic materials structure. A flexural-pivot-based precision linear stage has been designed to perform a wire scan as a differential aperture for the 3-D diffraction microscope at the Advanced Photon Source, Argonne National Laboratory. The mechanical design and finite element analyses of the flexural stage, as well as its initial mechanical test results with laser interferometer are described in this paper.

Measurement of X-ray attenuation coefficients around K-absorption edges using Fe Kα X-rays

International Nuclear Information System (INIS)

Kerur, B.R.; Thontadarya, S.R.; Hanumaiah, B.

1993-01-01

The x-ray mass attenuation coefficients were measured around the K-absorption edges of elements in the range 16 ≤ Z ≤ 30 using Fe Kα x-rays of energy 6.400 keV, which is the weighted average energy of Kα 1 and Kα 2 x-ray components from the 57 Co radioactive source. Kβ x-rays were almost eliminated by the differential absorption technique. The small difference in energy between Kα 1 and Kα 2 , 13 eV, was shown to be inconsequential by comparing the measured and theoretical values of μ/ρ for standard materials such as Al, Cu, Mo and Ta. The effect of fine structure of the K-absorption edge on μ/ρ was elucidated by using the compounds of elements in the range 16 ≤ X ≤ 30, containing one element with its K-absorption edge energy (E k ) close to the incident photon energy (E x ). The results clearly indicate the validity of the theoretical mixture rule for all those compounds whose K edge is far away from the incident energy but show deviations of as much as 10% for the manganese compound whose K edge is 140 eV above E x and about 12% for the chromium compound whose K edge is 410 eV below E x . These deviations are attributed to the possible influence of resonance Raman scattering when the incident photon energy E x is less than the edge and to the influence of EXAFS when E x is more than the edge energy. (Author)

Present status and future prospect of x-ray microscopes. Is it possible to realize x-ray 1 nm imaging?

International Nuclear Information System (INIS)

Aoki, Sadao

2010-01-01

High resolution X-ray imaging has been developed by using various optical elements and optical systems. In the soft X-ray region (∼3 nm) about 20 nm spatial resolution has been obtained, while in the hard X-ray (∼0.1 nm) about 50 nm. In the research frontier the spatial resolution better than 10 nm has been reported. The possibility to approach 1 nm spatial resolution is presented. (author)

Using the scanning electron microscope and energy dispersive x-ray spectrometer to do mineral identification and compositional point counting on unconsolidated marine sediments

International Nuclear Information System (INIS)

Robson, S.H.

1982-01-01

This paper describes a rapid and accurate method of point-counting sands and silt-size in unconsolidated open-ocean sediments. As traditional techniques for this operation cannot be employed on the fine-grained material which frequently forms the bulk of deep sea marine sediments, an alternative method has been sought. The method described makes use of equipment known as QUANTEX-RAY comprising a computerised data acquisition and reduction system designed for use in X-ray energy spectrometry and used in conjunction with a scanning electron microscope (SEM). Grains that cannot be identified by their visual morphology in the scanning electron microscope are analysed by X-ray spectrometry. Spectra are acquired in 200 seconds or less and processed by a sequence of software routines under semi-automatic control producing a listing of oxide concentrations as the final result. Each user must customize the control programme and operating conditions to suit his requirements

Quantitative x-ray microanalysis in an AEM: instrumental considerations and applications to materials science

International Nuclear Information System (INIS)

Zaluzec, N.J.

1979-01-01

There are a wide variety of instrumental problems which are present to some degree in all AEM instruments. The nature and magnitude of these artifacts can in some instances preclude the simple quantitative interpretation of the recorded x-ray emission spectrum using a thin-film electron excitation model; however, by judicious modifications to the instrument these complications can be effectively eliminated. The specific operating conditions of the microscope necessarily vary from one analysis to another depending on the type of specimen and experiment being performed. In general, however, the overall performance of the AEM system during x-ray analysis is optimized using the highest attainable incident electron energy; selecting the maximum probe diameter and probe current consistent with experimental limitations; and positioning the x-ray detector in a geometry such that it records information from the electron entrance surface of the specimen

Optical Analysis of an Ultra-High resolution Two-Mirror Soft X-Ray Microscope

Science.gov (United States)

Shealy, David L.; Wang, Cheng; Hoover, Richard B.

1994-01-01

This work has summarized for a Schwarzschild microscope some relationships between numerical aperture (NA), magnification, diameter of the primary mirror, radius of curvature of the secondary mirror, and the total length of the microscope. To achieve resolutions better than a spherical Schwarzschild microscope of 3.3 Lambda for a perfectly aligned and fabricated system. it is necessary to use aspherical surfaces to control higher-order aberrations. For an NA of 0.35, the aspherical Head microscope provides diffraction limited resolution of 1.4 Lambda where the aspherical surfaces differ from the best fit spherical surface by approximately 1 micrometer. However, the angle of incidence varies significantly over the primary and the secondary mirrors, which will require graded multilayer coatings to operate near peak reflectivities. For higher numerical apertures, the variation of the angle of incidence over the secondary mirror surface becomes a serious problem which must be solved before multilayer coatings can be used for this application. Tolerance analysis of the spherical Schwarzschild microscope has shown that water window operations will require 2-3 times tighter tolerances to achieve a similar performance for operations with 130 A radiation. Surface contour errors have been shown to have a significant impact on the MTF and must be controlled to a peak-to-valley variation of 50-100 A and a frequency of 8 periods over the surface of a mirror.

X-ray imaging system

International Nuclear Information System (INIS)

Houston, J.M.

1980-01-01

A novel, high-speed apparatus for use in X-ray computerised tomography is described in detail. It consists of a semi-circular array of X-ray sources, collimators and an ion chamber array for detection of the X-rays. The X-ray sources may be pulsed in salvos such that the corresponding detectors in the array are only illuminated by one source. The use of computer controlled salvos speeds up the image processing by at least a factor of two. The ion chamber array is designed to have a constant detection efficiency for varying angles of X-ray incidence. A detailed description of the detector construction and suggested gaseous fillings are given. It is claimed that the present tomographic system allows fast and accurate imaging of internal body organs and is insensitive to the blurring effects which motion of these organs tends to produce. (UK)

A mirror for lab-based quasi-monochromatic parallel x-rays.

Science.gov (United States)

Nguyen, Thanhhai; Lu, Xun; Lee, Chang Jun; Jung, Jin-Ho; Jin, Gye-Hwan; Kim, Sung Youb; Jeon, Insu

2014-09-01

A multilayered parabolic mirror with six W/Al bilayers was designed and fabricated to generate monochromatic parallel x-rays using a lab-based x-ray source. Using this mirror, curved bright bands were obtained in x-ray images as reflected x-rays. The parallelism of the reflected x-rays was investigated using the shape of the bands. The intensity and monochromatic characteristics of the reflected x-rays were evaluated through measurements of the x-ray spectra in the band. High intensity, nearly monochromatic, and parallel x-rays, which can be used for high resolution x-ray microscopes and local radiation therapy systems, were obtained.

Study of the grazing-incidence X-ray scattering of strongly disturbed fractal surfaces

Energy Technology Data Exchange (ETDEWEB)

Roshchin, B. S., E-mail: ross@crys.ras.ru; Chukhovsky, F. N.; Pavlyuk, M. D.; Opolchentsev, A. M.; Asadchikov, V. E. [Russian Academy of Sciences, Shubnikov Institute of Crystallography, Federal Research Centre “Crystallography and Photonics” (Russian Federation)

2017-03-15

The applicability of different approaches to the description of hard X-ray scattering from rough surfaces is generally limited by a maximum surface roughness height of no more than 1 nm. Meanwhile, this value is several times larger for the surfaces of different materials subjected to treatment, especially in the initial treatment stages. To control the roughness parameters in all stages of surface treatment, a new approach has been developed, which is based on a series expansion of wavefield over the plane eigenstate-function waves describing the small-angle scattering of incident X-rays in terms of plane q-waves propagating through the interface between two media with a random function of relief heights. To determine the amplitudes of reflected and transmitted plane q-waves, a system of two linked integral equations was derived. The solutions to these equations correspond (in zero order) to the well-known Fresnel expressions for a smooth plane interface. Based on these solutions, a statistical fractal model of an isotropic rough interface is built in terms of root-mean-square roughness σ, two-point correlation length l, and fractal surface index h. The model is used to interpret X-ray scattering data for polished surfaces of single-crystal cadmium telluride samples.

Tomosynthesis can facilitate accurate measurement of joint space width under the condition of the oblique incidence of X-rays in patients with rheumatoid arthritis.

Science.gov (United States)

Ono, Yohei; Kashihara, Rina; Yasojima, Nobutoshi; Kasahara, Hideki; Shimizu, Yuka; Tamura, Kenichi; Tsutsumi, Kaori; Sutherland, Kenneth; Koike, Takao; Kamishima, Tamotsu

2016-06-01

Accurate evaluation of joint space width (JSW) is important in the assessment of rheumatoid arthritis (RA). In clinical radiography of bilateral hands, the oblique incidence of X-rays is unavoidable, which may cause perceptional or measurement error of JSW. The objective of this study was to examine whether tomosynthesis, a recently developed modality, can facilitate a more accurate evaluation of JSW than radiography under the condition of oblique incidence of X-rays. We investigated quantitative errors derived from the oblique incidence of X-rays by imaging phantoms simulating various finger joint spaces using radiographs and tomosynthesis images. We then compared the qualitative results of the modified total Sharp score of a total of 320 joints from 20 patients with RA between these modalities. A quantitative error was prominent when the location of the phantom was shifted along the JSW direction. Modified total Sharp scores of tomosynthesis images were significantly higher than those of radiography, that is to say JSW was regarded as narrower in tomosynthesis than in radiography when finger joints were located where the oblique incidence of X-rays is expected in the JSW direction. Tomosynthesis can facilitate accurate evaluation of JSW in finger joints of patients with RA, even with oblique incidence of X-rays. Accurate evaluation of JSW is necessary for the management of patients with RA. Through phantom and clinical studies, we demonstrate that tomosynthesis may achieve more accurate evaluation of JSW.

Sample analysis using gamma ray induced fluorescent X-ray emission

Energy Technology Data Exchange (ETDEWEB)

Sood, B S; Allawadhi, K L; Gandhi, R; Batra, O P; Singh, N [Punjabi Univ., Patiala (India). Nuclear Science Labs.

1983-01-01

A non-destructive method for the analysis of materials using gamma ray-induced fluorescent x-ray emission has been developed. In this method, special preparation of very thin samples in which the absorption of the incident gamma rays and the emitted fluorescent x-rays is negligible, is not needed, and the absorption correction is determined experimentally. A suitable choice of the incident gamma ray energies is made to minimise enhancement effects through selective photoionization of the elements in the sample. The method is applied to the analysis of a typical sample of the soldering material using 279 keV and 59.5 keV gamma rays from /sup 203/Hg and /sup 241/Am radioactive sources respectively. The results of the analysis are found to agree well with those obtained from the chemical analysis.

X-ray magnetic microscopy for correlations between magnetic domains and crystal structure

International Nuclear Information System (INIS)

Denbeaux, G.; Anderson, E.; Bates, B.; Chao, W.; Liddle, J.A.; Harteneck, B.; Pearson, A.; Salmassi, F.; Schneider, G.; Fischer, P.; Eimuller, T.; Taylor, S.; Chang, H.; Kusinski, G.J.

2002-01-01

Accurately determining the resolution of x-ray microscopes has been a challenge because good test patterns for x-ray microscopy have been hard to make. We report on a sputter-deposited multilayer imaged in cross section as a test pattern with small features and high aspect ratios. One application of high-resolution imaging is magnetic materials. Off-axis bend magnet radiation is known to have a component of circular polarization which can be used for x-ray magnetic circular dichroism. We calculate the integrated circular polarization collected by the illumination optics in the XM-1 full-field x-ray microscope. (authors)

Toward Adaptive X-Ray Telescopes

Science.gov (United States)

O'Dell, Stephen L.; Atkins, Carolyn; Button, Tim W.; Cotroneo, Vincenzo; Davis, William N.; Doel, Peer; Feldman, Charlotte H.; Freeman, Mark D.; Gubarev, Mikhail V.; Kolodziejczak, Jeffrey J.;

X-ray metrology for ULSI structures

International Nuclear Information System (INIS)

Bowen, D. K.; Matney, K. M.; Wormington, M.

1998-01-01

Non-destructive X-ray metrological methods are discussed for application to both process development and process control of ULSI structures. X-ray methods can (a) detect the unacceptable levels of internal defects generated by RTA processes in large wafers, (b) accurately measure the thickness and roughness of layers between 1 and 1000 nm thick and (c) can monitor parameters such as crystallographic texture and the roughness of buried interfaces. In this paper we review transmission X-ray topography, thin film texture measurement, grazing-incidence X-ray reflectivity and high-resolution X-ray diffraction. We discuss in particular their suitability as on-line sensors for process control

Glancing-incidence X-ray diffraction of Ag nanoparticles in gold lustre decoration of Italian Renaissance pottery

Energy Technology Data Exchange (ETDEWEB)

Bontempi, E.; Colombi, P.; Depero, L.E. [Universita di Brescia, Laboratorio di Chimica per le Tecnologie and INSTM, Brescia (Italy); Cartechini, L. [Universita di Perugia, Istituto di Scienze e Tecnologie Molecolari-CNR, Sezione di Perugia, Perugia (Italy); Presciutti, F.; Brunetti, B.G. [Universita di Perugia, INSTM and Centro di Eccellenza SMAArt, Dipartimento di Chimica, Perugia (Italy); Sgamellotti, A. [Universita di Perugia, Istituto di Scienze e Tecnologie Molecolari-CNR, Sezione di Perugia, Perugia (Italy); Universita di Perugia, INSTM and Centro di Eccellenza SMAArt, Dipartimento di Chimica, Perugia (Italy)

2006-06-15

Lustre is known as one of the most significant decorative techniques of Medieval and Renaissance pottery in the Mediterranean basin, characterized by brilliant gold and red metallic reflections and iridescence effects. Previous studies by various techniques (SEM-EDS and TEM, UV-VIS, XRF, RBS and EXAFS) demonstrated that lustre consists of a heterogeneous metal-glass composite film, formed by Cu and Ag nanoparticles dispersed within the outer layer of a tin-opacified lead glaze. In the present work the investigation of an original gold lustre sample from Deruta has been carried out by means of glancing-incidence X-ray diffraction techniques (GIXRD). The study was aimed at providing information on structure and depth distribution of Ag nanoparticles. Exploiting the capability of controlling X-ray penetration in the glaze by changing the incidence angle, we used GIXRD measurements to estimate non-destructively thickness and depth of silver particles present in the first layers of the glaze. (orig.)

Glancing-incidence X-ray diffraction of Ag nanoparticles in gold lustre decoration of Italian Renaissance pottery

International Nuclear Information System (INIS)

Bontempi, E.; Colombi, P.; Depero, L.E.; Cartechini, L.; Presciutti, F.; Brunetti, B.G.; Sgamellotti, A.

2006-01-01

Lustre is known as one of the most significant decorative techniques of Medieval and Renaissance pottery in the Mediterranean basin, characterized by brilliant gold and red metallic reflections and iridescence effects. Previous studies by various techniques (SEM-EDS and TEM, UV-VIS, XRF, RBS and EXAFS) demonstrated that lustre consists of a heterogeneous metal-glass composite film, formed by Cu and Ag nanoparticles dispersed within the outer layer of a tin-opacified lead glaze. In the present work the investigation of an original gold lustre sample from Deruta has been carried out by means of glancing-incidence X-ray diffraction techniques (GIXRD). The study was aimed at providing information on structure and depth distribution of Ag nanoparticles. Exploiting the capability of controlling X-ray penetration in the glaze by changing the incidence angle, we used GIXRD measurements to estimate non-destructively thickness and depth of silver particles present in the first layers of the glaze. (orig.)

Glancing-incidence X-ray diffraction of Ag nanoparticles in gold lustre decoration of Italian Renaissance pottery

Science.gov (United States)

Bontempi, E.; Colombi, P.; Depero, L. E.; Cartechini, L.; Presciutti, F.; Brunetti, B. G.; Sgamellotti, A.

2006-06-01

Lustre is known as one of the most significant decorative techniques of Medieval and Renaissance pottery in the Mediterranean basin, characterized by brilliant gold and red metallic reflections and iridescence effects. Previous studies by various techniques (SEM-EDS and TEM, UV-VIS, XRF, RBS and EXAFS) demonstrated that lustre consists of a heterogeneous metal-glass composite film, formed by Cu and Ag nanoparticles dispersed within the outer layer of a tin-opacified lead glaze. In the present work the investigation of an original gold lustre sample from Deruta has been carried out by means of glancing-incidence X-ray diffraction techniques (GIXRD). The study was aimed at providing information on structure and depth distribution of Ag nanoparticles. Exploiting the capability of controlling X-ray penetration in the glaze by changing the incidence angle, we used GIXRD measurements to estimate non-destructively thickness and depth of silver particles present in the first layers of the glaze.

Women and x-rays

Energy Technology Data Exchange (ETDEWEB)

Dunkley, P A; Stewart, J H

1976-01-01

When a woman comes to an X-Ray Department it is usually necessary to know the present stage of her menstrual cycle. X-Rays may have an adverse effect on the embryo, especially in early pregnancy. However, exposure to X-Rays at any stage may be associated with a slightly increased incidence of malignant disease in childhood. The International Commission on Radiological Protection recommends that in women of child-bearing age (in some cases as young as 11 years), non-urgent diagnostic radiography be confined to the preovulatory phase of the menstrual cycle: that is, 14 days following the first day of the last menstrual period.

Simultaneous analysis of Grazing Incidence X-Ray reflectivity and X-ray standing waves from periodic multilayer systems

NARCIS (Netherlands)

Yakunin, S.N.; Makhotkin, Igor Alexandrovich; Chuyev, M.A.; Seregin, A.Y.; Pashayev, E.M.; Louis, Eric; van de Kruijs, Robbert Wilhelmus Elisabeth; Bijkerk, Frederik; Kovalchuk, M.V.

2012-01-01

Structural analysis of periodic multilayers with small period thickness (~4 nm) is a challenging task, especially when thicknesses of intermixed interfaces become comparable to individual layer thicknesses. In general, angular dependent X-ray fluorescence measurements, excited by the X-ray standing

Grazing incidence small angle X-ray scattering study of silver nanoparticles in ion-exchanged glasses

Energy Technology Data Exchange (ETDEWEB)

Cheng, Weidong, E-mail: 57399942@qq.com [College of Materials Science and Engineering, Qiqihar University, Qiqihar 161006 (China); Wu, Zhaojun [Department of Practice Teaching and Equipment Management, Qiqihar University, Qiqihar 161006 (China); Gu, Xiaohua [College of Materials Science and Engineering, Qiqihar University, Qiqihar 161006 (China); Xing, Xueqing; Mo, Guang [Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049 (China); Wu, Zhonghua, E-mail: wuzh@ihep.ac.cn [Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049 (China)

2015-05-15

The size and distribution of silver nanoparticles in ion-exchanged silicate glass induced by thermal treatments in air at different temperatures were investigated by means of grazing incidence small angle X-ray scattering technique, X-ray diffraction and optical absorption spectra. Silver–sodium ion exchange of soda-lime silicate glasses was done at 350 °C for 240 min, then the samples were treated by thermal annealing in air at different temperatures 400, 500 and 550 °C, respectively, for 1 h. After the annealing treatment above 400 °C for 1 h, smaller Ag nanoparticles occurred, together with bigger ones. Both dissolution of smaller Ag nanoparticles and diffusion of larger ones are discussed in these stages of annealing in this contribution.

X-ray investigation of Nb/O interfaces

International Nuclear Information System (INIS)

Delheusy, M.

2008-01-01

X-ray free electron lasers and the future International Linear Collider project are based on the performance of niobium superconducting RF cavities for efficient particle acceleration. A remarkable increase of the RF accelerating field is usually achieved by low-temperature annealing of the cavities (T≤150 C, several hours). The microscopic origin of this effect has remained unclear; however, it has been argued that a redistribution of subsurface interstitial oxygen into niobium is involved. In this study, the near surface structure of oxidized niobium single crystals and its evolution upon vacuum annealing has been studied by means of non-destructive in-situ surface sensitive x-ray techniques: x-ray reflectivity (XRR), grazing incidence x-ray diffraction (GIXD), diffuse scattering (GIDXS), crystal truncation rods measurements (CTRs), and high-resolution core-level spectroscopy (HRCLS). A first insight into the interplay between the oxide formation/dissolution and the occurrence of 181 subsurface interstitial oxygen has been given. The natural oxide on Nb(110) and Nb(100) surfaces is constituted of Nb 2 O 5 , NbO 2 and NbO, from the surface to the interface. It reduces progressively upon heating from Nb 2 O 5 to NbO 2 at low temperatures, and to NbO at 300 C. The Nb(110)/NbO(111) interface presents a Nishiyma-Wassermann epitaxial orientation relationship. The depth-distribution of interstitial oxygen has been established indicating that most of the oxygen is located in the direct vicinity of the oxide/niobium interface. No evidence of oxygen depletion below the oxide layer has been observed for the low temperature thermal treatments and surface preparations investigated in this study. (author) [fr

X-ray investigation of Nb/O interfaces

Energy Technology Data Exchange (ETDEWEB)

Delheusy, Melissa

2008-07-07

X-ray free electron lasers and the future International Linear Collider project are based on the performance of niobium superconducting rf cavities for efficient particle acceleration. A remarkable increase of the rf accelerating field is usually achieved by low-temperature annealing of the cavities (T<150 C, several hours). The microscopic origin of this effect has remained unclear; however, it has been argued that a redistribution of subsurface interstitial oxygen into niobium is involved. In this study, the near surface structure of oxidized niobium single crystals and its evolution upon vacuum annealing has been studied by means of non-destructive in-situ surface sensitive X-ray techniques: X-ray reflectivity (XRR), grazing incidence X-ray diffraction (GIXD), diffuse scattering (GIDXS), crystal truncation rods measurements (CTRs), and high-resolution core-level spectroscopy (HRCLS). A first insight into the interplay between the oxide formation/dissolution and the occurrence of subsurface interstitial oxygen has been given. The natural oxide on Nb(110) and Nb(100) surfaces is constituted of Nb{sub 2}O{sub 5}, NbO{sub 2} and NbO, from the surface to the interface. It reduces progressively upon heating from Nb{sub 2}O{sub 5} to NbO{sub 2} at low temperatures, and to NbO at 300 C. The Nb(110)/NbO(111) interface presents a Nishiyama-Wassermann epitaxial orientation relationship. The depth-distribution of interstitial oxygen has been established indicating that most of the oxygen is located in the direct vicinity of the oxide/niobium interface. No evidence of oxygen depletion below the oxide layer has been observed for the low temperature thermal treatments and surface preparations investigated in this study. (orig.)

Laboratory manual on sample preparation procedures for x-ray micro-analysis

International Nuclear Information System (INIS)

1997-01-01

X-ray micro fluorescence is a non-destructive and sensitive method for studying the microscopic distribution of different elements in almost all kinds of samples. Since the beginning of this century, x-rays and electrons have been used for the analysis of many different kinds of material. Techniques which rely on electrons are mainly developed for microscopic studies, and are used in conventional Electron Microscopy (EM) or Scanning Electron Microscopy (SEM), while x-rays are widely used for chemical analysis at the microscopic level. The first chemical analysis by fluorescence spectroscopy using small x-ray beams was conducted in 1928 by Glockner and Schreiber. Since then much work has been devoted to developing different types of optical systems for focusing an x-ray beam, but the efficiency of these systems is still inferior to the conventional electron optical systems. However, even with a poor optical efficiency, the x-ray microbeam has many advantages compared with electron or proton induced x-ray emission methods. These include: The analyses are non-destructive, losses of mass are negligible, and due to the low thermal loading of x-rays, materials which may be thermally degraded can be analysed; Samples can be analysed in air, and no vacuum is required, therefore specimens with volatile components such as water in biological samples, can be imaged at normal pressure and temperature; No charging occurs during analysis and therefore coating of the sample with a conductive layer is not necessary; With these advantages, simpler sample preparation procedures including mounting and preservation can be used

Accuracy evaluation of a Compton X-ray spectrometer with bremsstrahlung X-rays generated by a 6 MeV electron bunch

Energy Technology Data Exchange (ETDEWEB)

Kojima, Sadaoki, E-mail: kojima-s@ile.osaka-u.ac.jp; Arikawa, Yasunobu; Zhang, Zhe; Ikenouchi, Takahito; Morace, Alessio; Nagai, Takahiro; Abe, Yuki; Sakata, Shouhei; Inoue, Hiroaki; Utsugi, Masaru; Nakai, Mitsuo; Nishimura, Hiroaki; Shiraga, Hiroyuki; Fujioka, Shinsuke; Azechi, Hiroshi [Institute of Laser Engineering, Osaka University, 2-6 Yamada-oka, Suita, Osaka 565-0871 (Japan); Nishimura, Yasuhiko; Togawa, Hiromi [Toyota Technical Development Corporation, 1-21 Imae, Hanamoto-cho, Toyota, Aichi 470-0334 (Japan); Ozaki, Tetsuo [National Institute for Fusion Science, 322-6 Oroshicho, Toki, Gifu 509-5292 (Japan); Kato, Ryukou [The Institute of Science and Industrial Research, Osaka University, 2-6 Yamada-oka, Suita, Osaka (Japan)

2014-11-15

A Compton-scattering-based X-ray spectrometer is developed to obtain the energy distribution of fast electrons produced by intense laser and matter interactions. Bremsstrahlung X-rays generated by fast electrons in a material are used to measure fast electrons’ energy distribution in matter. In the Compton X-ray spectrometer, X-rays are converted into recoil electrons by Compton scattering in a converter made from fused silica glass, and a magnet-based electron energy analyzer is used to measure the energy distribution of the electrons that recoil in the direction of the incident X-rays. The spectrum of the incident X-rays is reconstructed from the energy distribution of the recoil electrons. The accuracy of this spectrometer is evaluated using a quasi-monoenergetic 6 MeV electron bunch that emanates from a linear accelerator. An electron bunch is injected into a 1.5 mm thick tungsten plate to produce bremsstrahlung X-rays. The spectrum of these bremsstrahlung X-rays is obtained in the range from 1 to 9 MeV. The energy of the electrons in the bunch is estimated using a Monte Carlo simulation of particle-matter interactions. The result shows that the spectrometer's energy accuracy is ±0.5 MeV for 6.0 MeV electrons.

On the polarization mixing of X-rays

International Nuclear Information System (INIS)

Ohkawa, T.; Hashimoto, H.

1984-01-01

Relativistic quantum field theory is applied to discuss the process of interference of white X-rays and the mechanism of rotation of the polarization of X-rays in crystals. A two-photon state is studied theoretically for analyzing the mechanism of the polarization mixing. Diffracted X-ray photons are produced by two successive stages of interaction between incident X-rays and electrons in a crystal. A dispersion relation of diffracted X-rays similar to Laue's dynamic theory is shown by use of the S-matrix. A dynamical structure factor is defined on the base of Dirac's γ-matrix. (author)

Penetration Depth and Defect Image Contrast Formation in Grazing-Incidence X-ray Topography of 4H-SiC Wafers

Science.gov (United States)

Yang, Yu; Guo, Jianqiu; Goue, Ouloide Yannick; Kim, Jun Gyu; Raghothamachar, Balaji; Dudley, Michael; Chung, Gill; Sanchez, Edward; Manning, Ian

2018-02-01

Synchrotron x-ray topography in grazing-incidence geometry is useful for discerning defects at different depths below the crystal surface, particularly for 4H-SiC epitaxial wafers. However, the penetration depths measured from x-ray topographs are much larger than theoretical values. To interpret this discrepancy, we have simulated the topographic contrast of dislocations based on two of the most basic contrast formation mechanisms, viz. orientation and kinematical contrast. Orientation contrast considers merely displacement fields associated with dislocations, while kinematical contrast considers also diffraction volume, defined as the effective misorientation around dislocations and the rocking curve width for given diffraction vector. Ray-tracing simulation was carried out to visualize dislocation contrast for both models, taking into account photoelectric absorption of the x-ray beam inside the crystal. The results show that orientation contrast plays the key role in determining both the contrast and x-ray penetration depth for different types of dislocation.

Spatial resolution in depth-controlled surface sensitive x-ray techniques

International Nuclear Information System (INIS)

Yun, W.B.; Viccaro, P.J.

1992-01-01

The spatial resolution along the surface normal and the total depth probed are two important parameters in depth-controlled surface sensitive X-ray techniques employing grazing incidence geometry. The two parameters are analyzed in terms of optical properties (refractive indices) of the media involved and parameters of the incident X-ray beam: beam divergence, X-ray energy, and spectral bandwidth. We derive analytical expressions of the required beam divergence and spectral bandwidth of the incident beam as a function of the two parameters. Sample calculations are made for X-ray energies between 0.1 and 100 keV and for solid Be, Cu, and Au, representing material matrices consisting of low, medium, and high atomic number elements. A brief discussion on obtaining the required beam divergence and spectral bandwidth from present X-ray sources and optics is given

Resonant Soft X-ray Scattering of Cellulose Microstructure in Plant Primary Cell Walls

Science.gov (United States)

Ye, Dan; Kiemle, Sarah N.; Wang, Cheng; Cosgrove, Daniel J.; Gomez, Esther W.; Gomez, Enrique D.

Cellulosic biomass is the most abundant raw material available for the production of renewable and sustainable biofuels. Breaking down cellulose is the rate-limiting step in economical biofuel production; therefore, a detailed understanding of the microscopic structure of plant cell walls is required to develop efficient biofuel conversion methods. Primary cell walls are key determinants of plant growth and mechanics. Their structure is complex and heterogeneous, making it difficult to elucidate how various components such as pectin, hemicellulose, and cellulose contribute to the overall structure. The electron density of these wall components is similar; such that conventional hard X-ray scattering does not generate enough contrast to resolve the different elements of the polysaccharide network. The chemical specificity of resonant soft X-ray scattering allows contrast to be generated based on differences in chemistry of the different polysaccharides. By varying incident X-ray energies, we have achieved increased scattering contrast between cellulose and other polysaccharides from primary cell walls of onions. By performing scattering at certain energies, features of the network structure of the cell wall are resolved. From the soft X-ray scattering results, we obtained the packing distance of cellulose microfibrils embedded in the polysaccharide network.

Intensity of diffracted X-rays from biomolecules with radiation damage caused by strong X-ray pulses

International Nuclear Information System (INIS)

Kai, Takeshi; Tokuhisa, Atsushi; Moribayashi, Kengo; Fukuda, Yuji; Kono, Hidetoshi; Go, Nobuhiro

2014-01-01

In order to realize the coherent X-ray diffractive imaging of single biomolecules, the diffraction intensities, per effective pixel of a single biomolecule with radiation damage, caused by irradiation using a strong coherent X-ray pulse, were examined. A parameter survey was carried out for various experimental conditions, using a developed simulation program that considers the effect of electric field ionization, which was slightly reported on in previous studies. The two simple relationships among the parameters were identified as follows: (1) the diffraction intensity of a biomolecule slightly increases with the incident X-ray energy; and that (2) the diffraction intensity is approximately proportional to the target radius, when the radius is longer than 400 Å, since the upper limit of the incident intensity for damage to the biomolecules marginally changes with respect to the target radius. (author)

Thin film soft X-ray absorption filters

International Nuclear Information System (INIS)

Stattin, H.

1992-11-01

This report discusses the composition, reparation and performance of soft x-ray transmission filters for a water window soft x-ray microscope. Unbacked thin films of aluminum, silver and vanadium/aluminum were made by evaporation on a substrate from which they were released. Measured transmittances agree reasonably well with calculations. The report also includes some related theory and discussions about film preparation methods, film contamination and evaluation methods. 33 refs

X-ray nanoprobes and diffraction-limited storage rings: opportunities and challenges of fluorescence tomography of biological specimens

Energy Technology Data Exchange (ETDEWEB)

Jonge, Martin D. de, E-mail: martin.dejonge@synchrotron.org.au [Australian Synchrotron, 800 Blackburn Road, Clayton, Victoria 3168 (Australia); Ryan, Christopher G. [CSIRO Earth Science and Research Engineering, Clayton, Victoria 3168 (Australia); Jacobsen, Chris J. [Advanced Photon Source, Argonne National Laboratory, 9700 South Cass Avenue, Argonne, IL 60439 (United States); Department of Physics, Chemistry of Life Processes Institute, Northwestern University, 2170 Campus Drive, Evanston, IL 60208 (United States); Chemistry of Life Processes Institute, Northwestern University, 2170 Campus Drive, Evanston, IL 60208 (United States)

2014-08-27

Nanoscale X-ray scanning microscopes, or X-ray nanoprobes, will benefit greatly from diffraction-limited storage rings. Here the requirements for nanoscale fluorescence tomography are explored to gain insight into the scientific opportunities and technical challenges that such sources offer. X-ray nanoprobes require coherent illumination to achieve optic-limited resolution, and so will benefit directly from diffraction-limited storage rings. Here, the example of high-resolution X-ray fluorescence tomography is focused on as one of the most voracious demanders of coherent photons, since the detected signal is only a small fraction of the incident flux. Alternative schemes are considered for beam delivery, sample scanning and detectors. One must consider as well the steps before and after the X-ray experiment: sample preparation and examination conditions, and analysis complexity due to minimum dose requirements and self-absorption. By understanding the requirements and opportunities for nanoscale fluorescence tomography, one gains insight into the R&D challenges in optics and instrumentation needed to fully exploit the source advances that diffraction-limited storage rings offer.

Time-resolved X-ray transmission microscopy on magnetic microstructures

International Nuclear Information System (INIS)

Puzic, Aleksandar

2007-01-01

Three excitation schemes were designed for stroboscopic imaging of magnetization dynamics with time-resolved magnetic transmission X-ray microscopy (TR-MTXM). These techniques were implemented into two types of X-ray microscopes, namely the imaging transmission X-ray microscope (ITXM) and the scanning transmission X-ray microscope (STXM), both installed at the electron storage ring of the Advanced Light Source in Berkeley, USA. Circular diffraction gratings (Fresnel zone plates) used in both microscopes as focusing and imaging elements presently allow for lateral resolution down to 30 nm. Magnetic imaging is performed by using the X-ray magnetic circular dichroism (XMCD) as element specific contrast mechanism. The developed methods have been successfully applied to the experimental investigation of magnetization dynamics in ferromagnetic microstructures. A temporal resolution well below 100 ps was achieved. A conventional pump-probe technique was implemented first. The dynamic response of the magnetization excited by a broadband pulsed magnetic field was imaged spatially resolved using focused X-ray flashes. As a complementary method, the spatially resolved ferromagnetic resonance (SR-FMR) technique was developed for experimental study of magnetization dynamics in the frequency domain. As a third excitation mode, the burst excitation was implemented. The performance and efficiency of the developed methods have been demonstrated by imaging the local magnetization dynamics in laterally patterned ferromagnetic thin-film elements and three-layer stacks. The existence of multiple eigenmodes in the excitation spectra of ferromagnetic microstructures has been verified by using the pump-probe technique. Magnetostatic spin waves were selectively excited and detected with a time resolution of 50 ps using the SR-FMR technique. Thorough analysis of 20 in most cases independently prepared samples has verified that vortices which exhibit a low-amplitude switching of their core

X-ray microscopy: An emerging technique for semiconductor microstructure characterization

International Nuclear Information System (INIS)

Padmore, H.A.

1998-05-01

The advent of third generation synchrotron radiation x-ray sources, such as the Advanced Light Source (ALS) at Berkeley have enabled the practical realization of a wide range of new techniques in which mature chemical or structural probes such as x-ray photoelectron spectroscopy (XPS) and x-ray diffraction are used in conjunction with microfocused x-ray beams. In this paper the characteristics of some of these new microscopes are described, particularly in reference to their applicability to the characterization of semiconductor microstructures

High-energy x-ray microscopy of laser-fusion plasmas at the National Ignition Facility

International Nuclear Information System (INIS)

Koch, J.A.; Landen, O.L.; Hammel, B.A.

1997-01-01

Multi-keV x-ray microscopy will be an important laser-produced plasma diagnostic at future megajoule facilities such as the National Ignition Facility (NIF).In preparation for the construction of this facility, we have investigated several instrumentation options in detail, and we conclude that near normal incidence single spherical or toroidal crystals may offer the best general solution for high-energy x-raymicroscopy at NIF and at similar large facilities. Kirkpatrick-Baez microscopes using multi-layer mirrors may also be good secondary options, particularly if apertures are used to increase the band-width limited field of view

Grazing incidence x-ray diffraction analysis of zeolite NaA membranes on porous alumina tubes.

Science.gov (United States)

Kyotani, Tomohiro

2006-07-01

Zeolite NaA-type membranes hydrothermally synthesized on porous alumina tubes, for dehydration process, were characterized by grazing incidence 2 theta scan X-ray diffraction analysis (GIXRD). The fine structure of the membrane was studied fractionally for surface layer and for materials embedded in the porous alumina tube. The thickness of the surface layer on the porous alumina tube in the membranes used in this study was approximately 2-3 microm as determined from transmission electron microscopy with focused ion beam thin-layer specimen preparation technique (FIB-TEM). To discuss the effects of the membrane surface morphology on the GIXRD measurements, CaA-type membrane prepared by ion exchange from the NaA-type membrane and surface-damaged NaA-type membrane prepared by water leaching were also studied. For the original NaA-type membrane, 2 theta scan GIXRD patterns could be clearly measured at X-ray incidence angles (alpha) ranging from 0.1 to 2.0 deg in increments of 0.1 deg. The surface layers of the 2 - 3 microm on the porous alumina tube correspond to the alpha values up to ca. 0.2 deg. For the CaA-type and the surface-damaged NaA-type membranes, however, diffraction patterns from the surface layer could not be successfully detected and the others were somewhat broad. For all the three samples, diffraction intensities of both zeolite and alumina increased with depth (X-ray incidence angle, alpha) in the porous alumina tube region. The depth profile analysis of the membranes based on the GIXRD first revealed that amount of zeolite crystal embedded in the porous alumina tube is much larger than that in the surface layer. Thus, the 2 theta scan GIXRD is a useful method to study zeolite crystal growth mechanism around (both inside and outside) the porous alumina support during hydrothermal synthesis and to study water permeation behavior in the dehydration process.

Self-consistent method for quantifying indium content from X-ray spectra of thick compound semiconductor specimens in a transmission electron microscope.

Science.gov (United States)

Walther, T; Wang, X

2016-05-01

Based on Monte Carlo simulations of X-ray generation by fast electrons we calculate curves of effective sensitivity factors for analytical transmission electron microscopy based energy-dispersive X-ray spectroscopy including absorption and fluorescence effects, as a function of Ga K/L ratio for different indium and gallium containing compound semiconductors. For the case of InGaN alloy thin films we show that experimental spectra can thus be quantified without the need to measure specimen thickness or density, yielding self-consistent values for quantification with Ga K and Ga L lines. The effect of uncertainties in the detector efficiency are also shown to be reduced. © 2015 The Authors Journal of Microscopy © 2015 Royal Microscopical Society.

The measurement and calculation of the X-ray spatial resolution obtained in the analytical electron microscope

International Nuclear Information System (INIS)

Michael, J.R.; Williams, D.B.

1990-01-01

The X-ray microanalytical spatial resolution is determined experimentally in various analytical electron microscopes by measuring the degradation of an atomically discrete composition profile across an interphase interface in a thin-foil of Ni-Cr-Fe. The experimental spatial resolutions are then compared with calculated values. The calculated spatial resolutions are obtained by the mathematical convolution of the electron probe size with an assumed beam-broadening distribution and the single-scattering model of beam broadening. The probe size is measured directly from an image of the probe in a TEM/SETEM and indirectly from dark-field signal changes resulting from scanning the probe across the edge of an MgO crystal in a dedicated STEM. This study demonstrates the applicability of the convolution technique to the calculation of the microanalytical spatial resolution obtained in the analytical electron microscope. It is demonstrated that, contrary to popular opinion, the electron probe size has a major impact on the measured spatial resolution in foils < 150 nm thick. (author)

Theoretical concepts of X-ray nanoscale analysis theory and applications

CERN Document Server

Benediktovitch, Andrei; Ulyanenkov, Alexander

2013-01-01

This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data ana

Development of X-ray microcalorimeter using Ir/Au-TES

International Nuclear Information System (INIS)

Kunieda, Yuichi; Ohno, Masashi; Nakazawa, Masaharu; Takahashi, Hiroyuki; Fukuda, Daiji; Ohkubo, Masataka; Hirayama, Huminori; Ataka, Manabu

2004-01-01

We are developing x-ray mirocalorimeters using transition edge sensors of iridium/gold (Ir/Au-TES) for high resolution x-ray spectroscopy. TES microcalorimeters can achieve faster response than conventional microcalorimeters by keeping the operating point of TES in the transition region through the use of strong negative electrothermal feedback (ETF). At present, the energy resolution of 9.4 eV (FWHM) was achieved for a 5899 eV Mn K al line. At a synchrotron X-ray radiation facility, we demonstrated microscopic signal response profile of the device and high-resolution X-ray fluorescence spectroscopy using a small amount of sample. (author)

MOS solid-state detector arrays for x-ray imaging

International Nuclear Information System (INIS)

Koppel, L.N.

1977-01-01

Two types of MOS detector arrays were used to sense directly patterns of soft x-rays, in the Lawrence Livermore Laboratory experimental laser-fusion program. A linear self-scanning photodiode array (SSPA) is used in a wave-length-dispersive spectrometer. A frame transfer charge-coupled device (CCD) facilitates the use of an x-ray microscope. Measurements and calculations of the x-ray sensitivity of these devices are presented. Their linearity and dynamic range are discussed, as well as data recovery systems for each detector. Experiences in using these devices to detect pulses of x-rays in laser-fusion experiments are described

On the determination of stress profiles in expanded austenite by grazing incidence X-ray diffraction and successive layer removal

DEFF Research Database (Denmark)

Fernandes, Frederico Augusto Pires; Christiansen, Thomas L.; Winther, Grethe

2015-01-01

Surface layers of expanded austenite resulting from nitriding typically exhibit large gradients in residual stress and composition. Evaluation of residual-stress profiles is explored by means of grazing incidence X-ray diffraction (GI-XRD), probing shallow depths, combined with successive layer...... removal. Several factors complicating the stress determination are analysed and discussed: (1) ghost stresses arising from a small variation in the shallow information depths probed with GI-XRD, (2) selection of the grain interaction model used to calculate the X-ray elastic constants for conversion...

Using of a microcapillary refractive X-ray lens for focusing and imaging

Energy Technology Data Exchange (ETDEWEB)

Dudchik, Yu.I. [Institute of Applied Physics Problems, Kurchatova 7, 220064, Minsk (Belarus)], E-mail: dudchik@bsu.by; Komarov, F.F. [Institute of Applied Physics Problems, Kurchatova 7, 220064, Minsk (Belarus); Piestrup, M.A. [Adelphi Technology, 981-B Industrial Rd, San Carlos, 94070, California (United States)], E-mail: melpie@adelphitech.com; Gary, C.K.; Park, H.; Cremer, J.T. [Adelphi Technology, 981-B Industrial Rd, San Carlos, 94070, California (United States)

2007-07-15

The microcapillary lens, formed by air bubbles in a hollow core glass capillary filled with epoxy, is a novel design of a compound refractive lens for X-rays. The epoxy enclosed between two air bubbles has the form of a biconcave lens and acts as a positive lens for X-rays. Each individual lens is spherical with radius of curvature equal to the inner radius of the capillary. Up to 500 individual biconcave lenses can be formed in a single capillary with diameters from 50 to 500 {mu}m. Due to the small radius of curvatures that can be achieved, microcapillary lenses typically have shorter focal lengths than those made by compression or injection molding. For example, microcapillary lenses with a focal length about 5 cm for 8 keV X-rays and 50-micron aperture are readily available. We have produced a set of lenses in a 200-micron inner-diameter glass capillary with 100-350 individual microlenses and measured their parameters at the Stanford Synchrotron Radiation Laboratory and at the Advanced Photon Source. Our investigations have also shown that the lenses are suitable for imaging applications with an X-ray tube as a source of X-rays. A simple X-ray microscope is discussed. The microscope consists of a copper anode X-ray tube, X-ray lens and CCD-camera. The object, lens and CCD-camera were placed in-line at distances to satisfy the lens formula. It is shown that the field of view of the microscope is about 1 mm and resolution is equal to 3-5 {mu}m.

Design and Tests of the Hard X-ray Polarimeter X-Calibur

Directory of Open Access Journals (Sweden)

M. Beilicke

2014-12-01

Full Text Available X-ray polarimetry promises to give qualitatively new information bout high-energy astrophysical sources, such as binary black hole  systems, micro-quasars, active galactic nuclei, and gamma-ray bursts. We designed, built and tested ahard X-ray polarimeter, X-Calibur, to be used in the focal plane of the InFOCuS grazing incidence hard X-ray telescope.X-Calibur combines a low-Z Compton scatterer with a CZT detector assembly to measure the polarization of 20−60 keV X-rays making use of the fact that polarized photons Compton scatter preferentially perpendicular to the electric field orientation; in principal, a similar space-borne experiment could be operated in the 5−100 keV regime. X-Calibur achieves a high detection efficiency of order unity.

Microscopic residual stress evolution during deformation process of an Fe---Mn---Si---Cr shape memory alloy investigated using white X-ray microbeam diffraction

International Nuclear Information System (INIS)

Kwon, E.P.; Sato, S.; Fujieda, S.; Shinoda, K.; Kajiwara, K.; Sato, M.; Suzuki, S.

2013-01-01

Microscopic residual stress evolution in different austenite (γ) grains during shape memory process in an Fe---Mn---Si---Cr alloy was investigated using the white X-ray microbeam diffraction technique. The use of high-energy white X-ray microbeam with small beam size allowed us to measure the microscopic residual stress in coarse γ grains with specific orientation. After tensile deformation large compressive residual stress was evolved in γ grains due to the formation of stress-induced ε martensite, but upon recovery heating it almost disappeared as a result of reverse transformation of martensite. The magnitude of compressive residual stress was higher in grains with orientations close to 〈144〉 and 〈233〉 orientations than in a grain with near 〈001〉 orientation. Analysis of the microstructure of each grain using electron backscattering diffraction suggested that the difference in the magnitude of compressive residual stress could be attributed to different martensitic transformation characteristics in the grains

Sub-25-nm laboratory x-ray microscopy using a compound Fresnel zone plate.

Science.gov (United States)

von Hofsten, Olov; Bertilson, Michael; Reinspach, Julia; Holmberg, Anders; Hertz, Hans M; Vogt, Ulrich

2009-09-01

Improving the resolution in x-ray microscopes is of high priority to enable future applications in nanoscience. However, high-resolution zone-plate optics often have low efficiency, which makes implementation in laboratory microscopes difficult. We present a laboratory x-ray microscope based on a compound zone plate. The compound zone plate utilizes multiple diffraction orders to achieve high resolution while maintaining reasonable efficiency. We analyze the illumination conditions necessary for this type of optics in order to suppress stray light and demonstrate microscopic imaging resolving 25 nm features.

X-ray diffraction imaging of material microstructures

KAUST Repository

Varga, Laszlo

2016-10-20

Various examples are provided for x-ray imaging of the microstructure of materials. In one example, a system for non-destructive material testing includes an x-ray source configured to generate a beam spot on a test item; a grid detector configured to receive x- rays diffracted from the test object; and a computing device configured to determine a microstructure image based at least in part upon a diffraction pattern of the x-rays diffracted from the test object. In another example, a method for determining a microstructure of a material includes illuminating a beam spot on the material with a beam of incident x-rays; detecting, with a grid detector, x-rays diffracted from the material; and determining, by a computing device, a microstructure image based at least in part upon a diffraction pattern of the x-rays diffracted from the material.

Performance evaluation of X-ray CT using visible scintillation light

International Nuclear Information System (INIS)

Kodama, Kiyoyuki; Hamada, Minoru; Suzuki, Tamotsu; Hashimoto, Masatoshi; Hanada, Takashi; Ide, Tatsuya; Maruyama, Koichi

2004-01-01

We proposed a new method of performance evaluation for X-ray CT using visible scintillation light and examined its usefulness in this study. When we scanned a plastic scintillator disk in a gantry opening of the X-ray CT, we could observe visible scintillation light. The rotation of the light-emitting area of the disk corresponded to that of the X-ray tube. We were able to record the scintillation light by digital video camera. By analyzing the area of visible scintillation light, the rotation speed of the X-ray tube, angular spread of the X-ray beam, uniformity of the incident X-rays, and change in X-ray energy were measured. No other method is available to obtain the above parameters of X-ray CT during a single CT scan. In the measurements of the uniformity of incident X-rays and change of X-ray energy, our method showed good accuracy in detecting the attenuation caused by the couch between the X-ray tube and the plastic scintillator disc. The proposed method is inexpensive and easy-to-use. We conclude that the method is a useful tool for performance evaluation as well as a maintenance tool for X-ray CT. (author)

Dependence on incident angle of solid state detector response to gamma-rays

International Nuclear Information System (INIS)

Yamanishi, Hirokuni; Yamaguchi, Satarou; Yamaguchi, Takayuki; Ueki, Kohtaro

2002-01-01

The shape and size of a NaI(Tl) scintillator that should maximize response variation with γ-ray incident angle was estimated by analytical model calculation. It proved that, even for gamma rays of energy exceeding 1 MeV, a slab detector measuring 50 cm x 50 cm x 5 cm thick should present a ratio of at least 4 between maximum and minimum responses against incidence at different angles. For a sample case of 60 keV gamma rays, estimation of the incident angle dependence by means of Monte Carlo simulation agreed well with experiment using a CZT detector. The counts from photo-electric peak varied with incident angle roughly along a sine curve. The foregoing finding served as basis for proposing a practical direction finder for γ-ray source operating on the principle of determining the source direction from variations in count with incident angle. (author)

Nano-fabrication of diffractive optics for soft X-ray and atom beam focusing

International Nuclear Information System (INIS)

Rehbein, S.

2002-01-01

Nano-structuring processes are described for manufacturing diffractive optics for the condenser-monochromator set-up of the transmission X-ray microscope (TXM) and for the scanning transmission X-ray microscope (STXM) at the BESSY II electron storage ring in Berlin. Furthermore, a process for manufacturing free-standing nickel zone plates for helium atom beam focusing experiments is presented. (author)

Full-field x-ray nano-imaging at SSRF

Science.gov (United States)

Deng, Biao; Ren, Yuqi; Wang, Yudan; Du, Guohao; Xie, Honglan; Xiao, Tiqiao

2013-09-01

Full field X-ray nano-imaging focusing on material science is under developing at SSRF. A dedicated full field X-ray nano-imaging beamline based on bending magnet will be built in the SSRF phase-II project. The beamline aims at the 3D imaging of the nano-scale inner structures. The photon energy range is of 5-14keV. The design goals with the field of view (FOV) of 20μm and a spatial resolution of 20nm are proposed at 8 keV, taking a Fresnel zone plate (FZP) with outermost zone width of 25 nm. Futhermore, an X-ray nano-imaging microscope is under developing at the SSRF BL13W beamline, in which a larger FOV will be emphasized. This microscope is based on a beam shaper and a zone plate using both absorption contrast and Zernike phase contrast, with the optimized energy set to 10keV. The detailed design and the progress of the project will be introduced.

Surface characterization of selected polymer thin films by total-reflection x-ray fluorescence spectroscopy and x-ray reflectivity

International Nuclear Information System (INIS)

Innis, Vallerie Ann A.

2006-01-01

Development of available x-ray characterizations tools for grazing incidence techniques was done to be able to probe nano-size thin films. Alignment of a Philips x-ray powder diffractometer was improved to let it perform as an x-ray reflectometer. X-ray reflectometry was coupled with total-reflection x-ray fluorescence spectroscopy. Evaluation of the performance of this grazing incidence techniques was done by preparing polymer thin films of carboxymethylcellulose, carrageenan and polyvinylpyrrolidone (PVP). The thickness of the films were varied by varying the process parameters such as concentration, spin speed and spin time. Angle-dispersive total-reflection x-ray fluorescence spectroscopy profiles of three films showed film formation only in carrageenan and PVP. For both carrageenan and PVP, an increase in concentration yielded a corresponding increase in intensity of the fluorescent or scattered peaks. XRR profiles of carrageenan thin films yielded a mean value for the critical angle close to quartz substrate. Thickness measurements of the prepared carrageenan thin films showed that concentration was the main determinant for final film thickness over the other process parameters. Sulfur fluorescent intensity derived from the TXRF measurement showed a linear relationship with the measured thickness by XRR. For PVP, measured critical angle is lower than quartz. Poor adhesion of the polymer onto the substrate yielded a limited number of thickness measurements made from the XRR profiles. (Author)

VETA-I x ray test analysis

Science.gov (United States)

Brissenden, R. J. V.; Chartas, G.; Freeman, M. D.; Hughes, J. P.; Kellogg, E. M.; Podgorski, W. A.; Schwartz, D. A.; Zhao, P.

1992-01-01

This interim report presents some definitive results from our analysis of the VETA-I x-ray testing data. It also provides a description of the hardware and software used in the conduct of the VETA-I x-ray test program performed at the MSFC x-ray Calibration Facility (XRCF). These test results also serve to supply data and information to include in the TRW final report required by DPD 692, DR XC04. To provide an authoritative compendium of results, we have taken nine papers as published in the SPIE Symposium, 'Grazing Incidence X-ray/EUV Optics for Astronomy and Projection Lithography' and have reproduced them as the content of this report.

Magnified hard x-ray microtomography: toward tomography with submicron resolution

Science.gov (United States)

Schroer, Christian G.; Benner, Boris; Guenzler, Til F.; Kuhlmann, Marion; Lengeler, Bruno; Rau, Christoph; Weitkamp, Timm; Snigirev, Anatoly A.; Snigireva, Irina

2002-01-01

Parabolic compound refractive lenses (PCRLs) are high quality imaging optics for hard x-rays that can be used as an objective lens in a new type of hard x-ray full field microscope. Using an aluminium PCRL, this new type of microscope has been shown to have a resolution of 350 nm. Further improvement of the resolution down to 50 nm can be expected using beryllium as a lens material. The large depth of field (several mm) of the microscope results in sharp projection images for samples that fit into the field of view of about 300 micrometers. This allows to combine magnified imaging with tomographic techniques. First results of magnified microtomography are shown. Contrast formation in the microscope and the consequences for tomographic reconstruction are discussed. An outlook on further developments is given.

Microscope Raman scattering and X-ray diffraction study of near-stoichiometric Ti:LiNbO3 waveguides

International Nuclear Information System (INIS)

Zhang, De-Long; Siu, G.G.; Pun, E.Y.B.

2005-01-01

The crystalline phase within guiding layers of near-stoichiometric strip and planar Ti:LiNbO 3 wave-guides, prepared by the method of simultaneous work of vapour transport equilibration (VTE) treatment and indiffusion of Ti film, was studied by combined confocal microscope Raman scattering and X-ray powder diffraction. The results show that the strip and planar waveguide layers still retain the LiNbO 3 phase and no other non-LiNbO 3 phases can be identified within the guiding layer. Li/Nb ratios inside and outside the strip and planar waveguide layers were determined from the microscope Raman scattering results and compared to those obtained from the measured optical absorption edge. It is shown that the Li/Nb ratios are homogeneous within the waveguide layer and are close inside and outside the waveguide layer. (copyright 2005 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim) (orig.)

Transmission X-ray mirror

International Nuclear Information System (INIS)

Lairson, B.M.; Bilderback, D.H.

1982-01-01

Transmission X-ray mirrors have been made from 400 A to 10 000 A thick soap films and have been shown to have novel properties. Using grazing angles of incidence, low energy X-rays were reflected from the front surface while more energetic X-rays were transmitted through the mirror largely unattenuated. A wide bandpass monochromator was made from a silicon carbide mirror followed by a soap film transmission mirror and operated in the white beam at the cornell High Energy Synchrotron Source (CHESS). Bandpasses of ΔE/E=12% to 18% were achieved at 13 keV with peak efficiencies estimated to be between 55% and 75%, respectively. Several wide angle scattering photographs of stretched polyethylene and a phospholipid were obtained in 10 s using an 18% bandpass. (orig.)

X-rays and magnetism

International Nuclear Information System (INIS)

Fischer, Peter; Ohldag, Hendrik

2015-01-01

Magnetism is among the most active and attractive areas in modern solid state physics because of intriguing phenomena interesting to fundamental research and a manifold of technological applications. State-of-the-art synthesis of advanced magnetic materials, e.g. in hybrid structures paves the way to new functionalities. To characterize modern magnetic materials and the associated magnetic phenomena, polarized x-rays have emerged as unique probes due to their specific interaction with magnetic materials. A large variety of spectroscopic and microscopic techniques have been developed to quantify in an element, valence and site-sensitive way properties of ferro-, ferri-, and antiferromagnetic systems, such as spin and orbital moments, and to image nanoscale spin textures and their dynamics with sub-ns time and almost 10 nm spatial resolution. The enormous intensity of x-rays and their degree of coherence at next generation x-ray facilities will open the fsec time window to magnetic studies addressing fundamental time scales in magnetism with nanometer spatial resolution. This review will give an introduction into contemporary topics of nanoscale magnetic materials and provide an overview of analytical spectroscopy and microscopy tools based on x-ray dichroism effects. Selected examples of current research will demonstrate the potential and future directions of these techniques. (report on progress)

SMART-X: Square Meter, Arcsecond Resolution Telescope for X-rays

Science.gov (United States)

Vikhlinin, Alexey; SMART-X Collaboration

2013-04-01

SMART-X is a concept for a next-generation X-ray observatory with large-area, 0.5" angular resolution grazing incidence adjustable X-ray mirrors, high-throughput critical angle transmission gratings, and X-ray microcalorimeter and CMOS-based imager in the focal plane. High angular resolution is enabled by new technology based on controlling the shape of mirror segments using thin film piezo actuators deposited on the back surface. Science applications include observations of growth of supermassive black holes since redshifts of ~10, ultra-deep surveys over 10's of square degrees, galaxy assembly at z=2-3, as well as new opportunities in the high-resolution X-ray spectroscopy and time domains. We also review the progress in technology development, tests, and mission design over the past year.

A critical evaluation of quantitative and qualitative analysis by means of energy-dispersive X-ray measurement in a scanning electron microscope

International Nuclear Information System (INIS)

Blum, F.

1978-12-01

The bombardment of solids in the scanning electron microscope (SEM) by means of energetic electrons results in the generation and emission of various signals that carry information about the characteristics of the target. Those signals which are related to the present context, e.g. the secondary and backscattered electrons as well as the characteristic and continuous X-radiation, are discussed. The brief description of the SEM and the energy dispersive X-ray (EDX) spectrometer is followed by a discussion of various obstacles affecting the reliability of X-ray intensity measurements and data reduction procedures. The observed relative X-ray intensities from pure elements were determined as a function of the atomic number. These functional dependence curves, which were established under standard conditions, served as reliable reference data for the purpose of quantitative corrections. The performance limits of a typical SEM-EDX analytical system were assessed by analysing quantitatively various types of standard reference materials and inhomogeneous samples. A brief discussion of the X-ray source is given in order to estimate whether the recorded X-ray intensities are representative of the electron bombarded areas. This is of importance when microanalyses are performed on inclusions or near phase boundaries. The use of oxide glasses which are suitable to evaluate and interrelative SEM-EDX systems is discussed. The analysis of metal alloys, which developed exaggerated surface topography when sputtered in an ion microprobe mass analyser or glow discharge lamp, is presented as a typical example for the investigation of rough-surface samples [af

Laboratory source based full-field x-ray microscopy at 9 keV

Energy Technology Data Exchange (ETDEWEB)

Fella, C.; Balles, A.; Wiest, W. [Lehrstuhl für Röntgenmikroskopie, Julius-Maximilians-Universität, 97074 Würzburg (Germany); Zabler, S.; Hanke, R. [Lehrstuhl für Röntgenmikroskopie, Julius-Maximilians-Universität, 97074 Würzburg (Germany); Fraunhofer Development Center X-Ray Technology (EZRT), Flugplatzstrasse 75, 90768 Fürth (Germany)

2016-01-28

In the past decade, hard x-ray transmission microscopy experienced tremendous developments. With the avail-ability of efficient Fresnel zone plates, even set-ups utilizing laboratory sources were developed [1]. In order to improve the performance of these x-ray microscopes, novel approaches to fabricate optical elements [2] and brighter x-ray tubes [3] are promising candidates. We are currently building a laboratory transmission x-ray microscope for 9.25 keV, using an electron impact liquid-metal-jet anode source. Up to now, the further elements of our setup are: a polycapillary condenser, a tungsten zone plate, and a scintillator which is optically coupled to a CMOS camera. However, further variations in terms of optical elements are intended. Here we present the current status of our work, as well as first experimental results.

Quasimonochromatic x-ray computed tomography by the balanced filter method using a conventional x-ray source

International Nuclear Information System (INIS)

Saito, Masatoshi

2004-01-01

A quasimonochromatic x-ray computed tomography (CT) system utilizing balanced filters has recently been developed for acquiring quantitative CT images. This system consisted of basic components such as a conventional x-ray generator for radiography, a stage for mounting and rotating objects, and an x-ray line sensor camera. Metallic sheets of Er and Yb were used as the balanced filters for obtaining quasimonochromatic incident x rays that include the characteristic lines of the W Kα doublet from a tungsten target. The mean energy and energy width of the quasimonochromatic x rays were determined to be 59.0 and 1.9 keV, respectively, from x-ray spectroscopic measurements using a high-purity Ge detector. The usefulness of the present x-ray CT system was demonstrated by obtaining spatial distributions of the linear attenuation coefficients of three selected samples--a 20 cm diameter cylindrical water phantom, a 3.5 cm diameter aluminum rod, and a human head phantom. The results clearly indicate that this apparatus is surprisingly effective for estimating the distribution of the linear attenuation coefficients without any correction of the beam-hardening effect. Thus, implementing the balanced filter method on an x-ray CT scanner has promise in producing highly quantitative CT images

Multilayer optics for monochromatic high-resolution X-ray imaging diagnostic in a broad photon energy range from 2 keV to 22 keV

International Nuclear Information System (INIS)

Troussel, Ph.; Dennetiere, D.; Maroni, R.; Høghøj, P.; Hedacq, S.; Cibik, L.; Krumrey, M.

2014-01-01

The “Commissariat à l’énergie atomique et aux énergies alternatives” (CEA) studies and designs advanced X-ray diagnostics to probe dense plasmas produced at the future Laser MegaJoule (LMJ) facility. Mainly for X-ray imaging with high spatial resolution, different types of multilayer mirrors were developed to provide broadband X-ray reflectance at grazing incidence. These coatings are deposited on two toroidal mirror substrates that are then mounted into a Wolter-type geometry (working at a grazing angle of 0.45°) to realize an X-ray microscope. Non-periodic (depth graded) W/Si multilayer can be used in the broad photon energy range from 2 keV to 22 keV. A third flat mirror can be added for the spectral selection of the microscope. This mirror is coated with a Mo/Si multilayer for which the d-spacing varies in the longitudinal direction to satisfy the Bragg condition within the angular acceptance of the microscope and also to compensate the angular dispersion due to the field of the microscope. We present a study of such a so-called Göbel mirror which was optimized for photon energy of 10.35 keV. The three mirrors were coated using magnetron sputtering technology by Xenocs SA. The reflectance in the entire photon energy range was determined in the laboratory of the Physikalisch-Technische Bundesanstalt (PTB) at the synchrotron radiation facility BESSY II in Berlin

Multilayer optics for monochromatic high-resolution X-ray imaging diagnostic in a broad photon energy range from 2 keV to 22 keV

Energy Technology Data Exchange (ETDEWEB)

Troussel, Ph., E-mail: philippe.troussel@cea.fr [CEA, DAM, DIF, F-91297 Arpajon (France); Dennetiere, D. [Synchrotron Soleil, L’orme des Merisiers, 91190 Saint-Aubin (France); Maroni, R. [CEA, DAM, DIF, F-91297 Arpajon (France); Høghøj, P.; Hedacq, S. [Xenocs SA, 19, rue François Blumet, F-38360 Sassenage (France); Cibik, L.; Krumrey, M. [Physikalisch-Technische Bundesanstalt (PTB), Abbestr. 2-12, 10587 Berlin (Germany)

2014-12-11

The “Commissariat à l’énergie atomique et aux énergies alternatives” (CEA) studies and designs advanced X-ray diagnostics to probe dense plasmas produced at the future Laser MegaJoule (LMJ) facility. Mainly for X-ray imaging with high spatial resolution, different types of multilayer mirrors were developed to provide broadband X-ray reflectance at grazing incidence. These coatings are deposited on two toroidal mirror substrates that are then mounted into a Wolter-type geometry (working at a grazing angle of 0.45°) to realize an X-ray microscope. Non-periodic (depth graded) W/Si multilayer can be used in the broad photon energy range from 2 keV to 22 keV. A third flat mirror can be added for the spectral selection of the microscope. This mirror is coated with a Mo/Si multilayer for which the d-spacing varies in the longitudinal direction to satisfy the Bragg condition within the angular acceptance of the microscope and also to compensate the angular dispersion due to the field of the microscope. We present a study of such a so-called Göbel mirror which was optimized for photon energy of 10.35 keV. The three mirrors were coated using magnetron sputtering technology by Xenocs SA. The reflectance in the entire photon energy range was determined in the laboratory of the Physikalisch-Technische Bundesanstalt (PTB) at the synchrotron radiation facility BESSY II in Berlin.

Multilayer optics for monochromatic high-resolution X-ray imaging diagnostic in a broad photon energy range from 2 keV to 22 keV

Science.gov (United States)

Troussel, Ph.; Dennetiere, D.; Maroni, R.; Høghøj, P.; Hedacq, S.; Cibik, L.; Krumrey, M.

2014-12-01

The "Commissariat à l'énergie atomique et aux énergies alternatives" (CEA) studies and designs advanced X-ray diagnostics to probe dense plasmas produced at the future Laser MegaJoule (LMJ) facility. Mainly for X-ray imaging with high spatial resolution, different types of multilayer mirrors were developed to provide broadband X-ray reflectance at grazing incidence. These coatings are deposited on two toroidal mirror substrates that are then mounted into a Wolter-type geometry (working at a grazing angle of 0.45°) to realize an X-ray microscope. Non-periodic (depth graded) W/Si multilayer can be used in the broad photon energy range from 2 keV to 22 keV. A third flat mirror can be added for the spectral selection of the microscope. This mirror is coated with a Mo/Si multilayer for which the d-spacing varies in the longitudinal direction to satisfy the Bragg condition within the angular acceptance of the microscope and also to compensate the angular dispersion due to the field of the microscope. We present a study of such a so-called Göbel mirror which was optimized for photon energy of 10.35 keV. The three mirrors were coated using magnetron sputtering technology by Xenocs SA. The reflectance in the entire photon energy range was determined in the laboratory of the Physikalisch-Technische Bundesanstalt (PTB) at the synchrotron radiation facility BESSY II in Berlin.

Novel x-ray imaging methods at the Nova Laser Facility

International Nuclear Information System (INIS)

Ress, D.; DaSilva, L.B.; London, R.A.; Trebes, J.E.; Lerche, R.A.; Bradley, D.K.

1994-01-01

We are pursuing several novel x-ray imaging schemes to measure plasma parameters in inertial-confinement fusion experiments. This paper will review two quite successful approaches, the soft x-ray moire deflectometer, and the annular (ring) coded-aperture microscope. The deflectometer is the newer diagnostic, and this paper will concentrate on this topic. We will describe the operating principles of moire deflectometry, give the motivations for soft x-ray probing, describe the physical apparatus in detail, and present some sample images and results. The ring coded-aperture microscope has been described previously, so here we will only briefly review the principle of the instrument. We will concentrate on the signal-to-noise ratio calculations that motivate the use of annular coded apertures, and describe recent work to predict and measure the resolution of the instrument

Grazing Incidence Wavefront Sensing and Verification of X-Ray Optics Performance

Science.gov (United States)

Saha, Timo T.; Rohrbach, Scott; Zhang, William W.

2011-01-01

Evaluation of interferometrically measured mirror metrology data and characterization of a telescope wavefront can be powerful tools in understanding of image characteristics of an x-ray optical system. In the development of soft x-ray telescope for the International X-Ray Observatory (IXO), we have developed new approaches to support the telescope development process. Interferometrically measuring the optical components over all relevant spatial frequencies can be used to evaluate and predict the performance of an x-ray telescope. Typically, the mirrors are measured using a mount that minimizes the mount and gravity induced errors. In the assembly and mounting process the shape of the mirror segments can dramatically change. We have developed wavefront sensing techniques suitable for the x-ray optical components to aid us in the characterization and evaluation of these changes. Hartmann sensing of a telescope and its components is a simple method that can be used to evaluate low order mirror surface errors and alignment errors. Phase retrieval techniques can also be used to assess and estimate the low order axial errors of the primary and secondary mirror segments. In this paper we describe the mathematical foundation of our Hartmann and phase retrieval sensing techniques. We show how these techniques can be used in the evaluation and performance prediction process of x-ray telescopes.

X-ray therapy with enhanced effectiveness

International Nuclear Information System (INIS)

Silberbauer, F.

1989-01-01

The introduction of iodine atoms into a malignant tumor by intravenous injection of a contrast medium that is excreted by way of the kidneys selectively increases the tumor's capacity for the absorption of X-ray photons. This effect is exploited in CCT, but in high-voltage X-ray therapy it leads to an elevated focal dose while the incident dose remains the same. (orig.) [de

Differential dose albedo for high-energy X-rays on concrete slab

International Nuclear Information System (INIS)

Kato, Hideki

2006-01-01

We computed the differential dose albedo (α D ) for high-energy X-rays on a concrete slab when the incident angle, reflection angle, and azimuth angle were changed, by means of Monte Carlo simulation. We found that α D changed with incident, reflection, and azimuth angles to the concrete slab. On the whole, the larger the incident angle, the larger α D tended to become. If the incident angle and reflection angle were the same, the larger the azimuth angle, the smaller α D tended to become. When the incident, reflection, and azimuth angles were the same, the smaller the X-ray energy was, the larger α D became, in the order of 10 MV, 6 MV, and 4 MV X-rays. (author)

U-shape rotating anti-cathode compact X-ray generator: 20 times stronger than the commercially available X-ray source

Energy Technology Data Exchange (ETDEWEB)

Sakabe, N., E-mail: sakabe-dsb@sbsp.jp; Sakabe, K. [High Energy Accelerator Research Organization (KEK), 1-1 Oho, Tsukuba 305-0801 (Japan); Foundation for Advancement of International Science (FAIS), Kasuga 3-chome, Tsukuba, Ibaraki 305-0821 (Japan); Ohsawa, S.; Sakai, T.; Kobayakawa, H.; Sugimura, T.; Ikeda, M.; Tawada, M. [High Energy Accelerator Research Organization (KEK), 1-1 Oho, Tsukuba, Ibaraki 305-0801 (Japan); Watanabe, N.; Sasaki, K. [Nagoya University, Chikusa, Nagoya, Aichi 464-8603 (Japan); Wakatsuki, M. [National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8568 (Japan)

2013-11-01

A new type of U-shape anti-cathode X-ray generator in which the inner surface of a cylindrical target is irradiated by an electron beam has been made by modifying a conventional rotating anti-cathode X-ray generator whose brightness in the catalog is 12 kW mm{sup −2}. A brightness of 129 kW mm{sup −2} was thereby obtained with this new U-shape-type X-ray generator. This new X-ray generator is expected to be of keen interest for applications in academia, industry and in hospitals. A new type of U-shape anti-cathode X-ray generator in which the inner surface of a cylindrical target is irradiated by an electron beam has been made by modifying a conventional rotating anti-cathode X-ray generator whose brightness in the catalog is 12 kW mm{sup −2}. The target material (Cu), target radius (50 mm) and rotating speed (6000 r.p.m.) were not changed in this modification. A brightness of 52 kW mm{sup −2} was obtained by this U-shape-type X-ray generator. This means that the brightness of the new type is 4.3 times greater than that of the old unmodified one. Furthermore, the new-type X-ray generator yielded a brightness of 129 kW mm{sup −2} by adding a carbon coating on the Cu target. This means an overall increase of brightness of ten times. The original generator has the highest brightness in the generators of the same class (having a radius of 50 mm and rotation speed of 6000 r.p.m.). Observations showed that Cu Kα counts at vertical incidence of the electron beam onto the surface of the new target, which is initially optically smooth, decrease as the surface is roughened by a severe thermal stress caused by strong electron beam exposure. Further observation reveals, however, that oblique incidence of the electron beam onto the roughened surface drastically increased the X-ray output and amounts to twice as much as that from a smooth surface at vertical incidence. Thus, at the present stage, an overall increase of brightness has been realised at a level 20 times

A Test Facility For Astronomical X-Ray Optics

DEFF Research Database (Denmark)

Lewis, R. A.; Bordas, J.; Christensen, Finn Erland

1989-01-01

Grazing incidence x-ray optics for x-ray astronomical applications are used outside the earths atmosphere. These devices require a large collection aperture and the imaging of an x-ray source which is essentially placed at infinity. The ideal testing system for these optical elements has...... to approximate that encountered under working conditions, however the testing of these optical elements is notoriously difficult with conventional x-ray generators. Synchrotron Radiation (SR) sources are sufficiently brilliant to produce a nearly perfect parallel beam over a large area whilst still retaining...... a flux considerably higher than that available from conventional x-ray generators. A facility designed for the testing of x-ray optics, particularly in connection with x-ray telescopes is described below. It is proposed that this facility will be accommodated at the Synchrotron Radiation Source...

High-speed image converter x-ray studies

International Nuclear Information System (INIS)

Bryukhnevitch, G.I.; Kas'yanov, Yu.S.; Korobkin, V.V.; Prokhorov, A.M.; Stepanov, B.M.; Chevokin, V.K.; Schelev, M.Ya.

1975-01-01

Two X-ray high-speed image-converter cameras (ICC) have been developed. In the first one a soft X-ray radiation is converted into visible light with the aid of a 0.5ns response time, plastic scintillator. The second camera incorporates a photocathode which is sensitive to visible and X-ray radiation. Its calculated temporal resolution approaches 5 to 7ps. Both developed cameras were employed for studies of X-ray radiation emitted by laser plasma. For the smooth nanosecond excited laser pulses, a noticeable amplitude modulation was recorded in all laser pulses reflected by plasma as well as in each third pulse of X-ray plasma radiation. It was also observed that the duration of X-ray plasma radiation is 20 to 40% shorter than that of the incident nanosecond laser pulses and this duration being 3 to 6 times longer than that of the picosecond irradiating pulses. The half-width of the recorded X-ray plasma pulses was 30 to 60ps. (author)

New generation quantitative x-ray microscopy encompassing phase-contrast

International Nuclear Information System (INIS)

Wilkins, S.W.; Mayo, S.C.; Gureyev, T.E.; Miller, P.R.; Pogany, A.; Stevenson, A.W.; Gao, D.; Davis, T.J.; Parry, D.J.; Paganin, D.

2000-01-01

Full text: We briefly outline a new approach to X-ray ultramicroscopy using projection imaging in a scanning electron microscope (SEM). Compared to earlier approaches, the new approach offers spatial resolution of ≤0.1 micron and includes novel features such as: i) phase contrast to give additional sample information over a wide energy range, rapid phase/amplitude extraction algorithms to enable new real-time modes of microscopic imaging widespread applications are envisaged to fields such as materials science, biomedical research, and microelectronics device inspection. Some illustrative examples are presented. The quantitative methods described here are also very relevant to X-ray projection microscopy using synchrotron sources

X-rays and photocarcinogenesis in hairless mice

DEFF Research Database (Denmark)

Lerche, Catharina M; Philipsen, Peter A; Wulf, Hans Christian

2013-01-01

It is well known that excessive X-ray radiation can cause non-melanoma skin cancers. With the increased incidence of sun-related skin cancer there is a need to investigate the combination of sunlight and X-rays. Immunocompetent C3.Cg/TifBomTac mice (n = 298) were divided into 12 groups. Mice were...

Tumours associated with medical X-ray therapy exposure in childhood

International Nuclear Information System (INIS)

Colman, M.; Kirsch, M.; Creditor, M.

1978-01-01

A total of 5166 persons who were exposed to limited field (80-100 cm 2 ) X-ray irradiation to the head, neck and upper chest region during childhood and adolescence have provided an outstanding opportunity for the study of tumour incidence following medical X-ray therapy. More than 3254 subjects have been traced, 3108 have completed questionnaires eliciting information on tumour incidence, and 1539 of these were subjected to a thorough clinical screening procedure that included a thyroid scintigram. The prevalence of thyroid tumours in the 1539 clinically screened subjects and the prevalence of all other tumours in the 3254 subjects traced can therefore be assumed to reflect the risks in the group of irradiated subjects as a whole. Median age at irradiation was 3.5 years, and median radiation dose 790 rads (7.9 Gy). Thyroid tumour was diagnosed in 413 subjects. Of those undergoing surgery (273) 30.3% were found to have thyroid cancer. A total of 366 surgical pathology specimens of the thyroid, including 93 from subjects who were diagnosed at other hospitals, were examined revealing 73 papillary carcinomas, 12 follicular carcinomas and 26 microscopic papillary carcinomas. One hundred and eighty-seven other (non-thyroid) neoplasmas identified included 27 benign and 10 malignant salivary gland tumours, 16 benign and seven malignant tumours of neural origin (brain, spinal cord, cranial and peripheral nerves), 37 skin tumours, 9 lymphomas, 8 gonadal tumours, 45 breast tumours and 28 tumours of miscellaneous sites. The incidence of thyroid tumours, salivary gland tumours and primary brain tumours was considerably in excess of the expected incidence (p values<0.0001), and a radiation dose-effect correlation was observed for thyroid and brain tumours. Gonadal tumours and lymphomas did not occur in excess of the expected incidence

Integrated circuit authentication using photon-limited x-ray microscopy.

Science.gov (United States)

Markman, Adam; Javidi, Bahram

2016-07-15

A counterfeit integrated circuit (IC) may contain subtle changes to its circuit configuration. These changes may be observed when imaged using an x-ray; however, the energy from the x-ray can potentially damage the IC. We have investigated a technique to authenticate ICs under photon-limited x-ray imaging. We modeled an x-ray image with lower energy by generating a photon-limited image from a real x-ray image using a weighted photon-counting method. We performed feature extraction on the image using the speeded-up robust features (SURF) algorithm. We then authenticated the IC by comparing the SURF features to a database of SURF features from authentic and counterfeit ICs. Our experimental results with real and counterfeit ICs using an x-ray microscope demonstrate that we can correctly authenticate an IC image captured using orders of magnitude lower energy x-rays. To the best of our knowledge, this Letter is the first one on using a photon-counting x-ray imaging model and relevant algorithms to authenticate ICs to prevent potential damage.

Spatially resolved single crystal x-ray spectropolarimetry of wire array z-pinch plasmas.

Science.gov (United States)

Wallace, M S; Haque, S; Neill, P; Pereira, N R; Presura, R

2018-01-01

A recently developed single-crystal x-ray spectropolarimeter has been used to record paired sets of polarization-dependent and axially resolved x-ray spectra emitted by wire array z-pinches. In this measurement, two internal planes inside a suitable crystal diffract the x-rays into two perpendicular directions that are normal to each other, thereby separating incident x-rays into their linearly polarized components. This paper gives considerations for fielding the instrument on extended sources. Results from extended sources are difficult to interpret because generally the incident x-rays are not separated properly by the crystal. This difficulty is mitigated by using a series of collimating slits to select incident x-rays that propagate in a plane of symmetry between the polarization-splitting planes. The resulting instrument and some of the spatially resolved polarized x-ray spectra recorded for a 1-MA aluminum wire array z-pinch at the Nevada Terawatt Facility at the University of Nevada, Reno will be presented.

On the determination of stress profiles in expanded austenite by grazing incidence X-ray diffraction and successive layer removal

International Nuclear Information System (INIS)

Fernandes, Frederico A.P.; Christiansen, Thomas L.; Winther, Grethe; Somers, Marcel A.J.

2015-01-01

Surface layers of expanded austenite resulting from nitriding typically exhibit large gradients in residual stress and composition. Evaluation of residual-stress profiles is explored by means of grazing incidence X-ray diffraction (GI-XRD), probing shallow depths, combined with successive layer removal. Several factors complicating the stress determination are analysed and discussed: (1) ghost stresses arising from a small variation in the shallow information depths probed with GI-XRD, (2) selection of the grain interaction model used to calculate the X-ray elastic constants for conversion of lattice strains into residual stress and (3) the composition dependence of these elastic constants

Transmission X-ray microscopy for full-field nano-imaging of biomaterials

Science.gov (United States)

ANDREWS, JOY C; MEIRER, FLORIAN; LIU, YIJIN; MESTER, ZOLTAN; PIANETTA, PIERO

2010-01-01

Imaging of cellular structure and extended tissue in biological materials requires nanometer resolution and good sample penetration, which can be provided by current full-field transmission X-ray microscopic techniques in the soft and hard X-ray regions. The various capabilities of full-field transmission X-ray microscopy (TXM) include 3D tomography, Zernike phase contrast, quantification of absorption, and chemical identification via X-ray fluorescence and X-ray absorption near edge structure (XANES) imaging. These techniques are discussed and compared in light of results from imaging of biological materials including microorganisms, bone and mineralized tissue and plants, with a focus on hard X-ray TXM at ≤ 40 nm resolution. PMID:20734414

Transmission X-ray microscopy for full-field nano imaging of biomaterials.

Science.gov (United States)

Andrews, Joy C; Meirer, Florian; Liu, Yijin; Mester, Zoltan; Pianetta, Piero

2011-07-01

Imaging of cellular structure and extended tissue in biological materials requires nanometer resolution and good sample penetration, which can be provided by current full-field transmission X-ray microscopic techniques in the soft and hard X-ray regions. The various capabilities of full-field transmission X-ray microscopy (TXM) include 3D tomography, Zernike phase contrast, quantification of absorption, and chemical identification via X-ray fluorescence and X-ray absorption near edge structure imaging. These techniques are discussed and compared in light of results from the imaging of biological materials including microorganisms, bone and mineralized tissue, and plants, with a focus on hard X-ray TXM at ≤ 40-nm resolution. Copyright © 2010 Wiley-Liss, Inc.

X-ray microscopy with high resolution zone plates -- Recent developments

International Nuclear Information System (INIS)

Schneider, G.; Wilhein, T.; Niemann, B.; Guttmann, P.

1995-01-01

In order to expand the applications of X-ray microscopy, developments in the fields of zone plate technology, specimen preparation and imaging techniques have been made. A new cross-linked polymer chain electron beam resist allows to record zone plate pattern down to 19 nm outermost zone width. High resolution zone plates in germanium with outermost zone widths down to 19 nm have been developed. In addition, phase zone plates in nickel down to 30 nm zone width have been made by electroplating. In order to enhance the image contrast for weak absorbing objects, the phase contrast method for X-ray microscopy was developed and implemented on the Goettingen X-ray microscope at BESSY. The effects of X-ray absorption on the structure of biological specimen limits the maximum applicable radiation dose and therefore the achievable signal to noise ratio for an artifact-free X-ray image. To improve the stability especially of biological specimen, a cryogenic object chamber has been developed and tested. It turns out that at the operating temperature T ≤ 130 K unfixed biological specimen can be exposed to a radiation dose of 10 9 --10 10 Gy without any observable structural changes. A multiple-angle viewing stage allows to take stereoscopic images with the X-ray microscope, giving a 3D-impression of the object

Fluorescent x-ray computed tomography to visualize specific material distribution

Science.gov (United States)

Takeda, Tohoru; Yuasa, Tetsuya; Hoshino, Atsunori; Akiba, Masahiro; Uchida, Akira; Kazama, Masahiro; Hyodo, Kazuyuki; Dilmanian, F. Avraham; Akatsuka, Takao; Itai, Yuji

1997-10-01

Fluorescent x-ray computed tomography (FXCT) is being developed to detect non-radioactive contrast materials in living specimens. The FXCT systems consists of a silicon channel cut monochromator, an x-ray slit and a collimator for detection, a scanning table for the target organ and an x-ray detector for fluorescent x-ray and transmission x-ray. To reduce Compton scattering overlapped on the K(alpha) line, incident monochromatic x-ray was set at 37 keV. At 37 keV Monte Carlo simulation showed almost complete separation between Compton scattering and the K(alpha) line. Actual experiments revealed small contamination of Compton scattering on the K(alpha) line. A clear FXCT image of a phantom was obtained. Using this system the minimal detectable dose of iodine was 30 ng in a volume of 1 mm3, and a linear relationship was demonstrated between photon counts of fluorescent x-rays and the concentration of iodine contrast material. The use of high incident x-ray energy allows an increase in the signal to noise ratio by reducing the Compton scattering on the K(alpha) line.

Adjustment of a low energy, X-rays generator (6 kV - 50 mA). Application to X-rays detectors calibration

International Nuclear Information System (INIS)

Legistre, C.

1995-02-01

The aim of this memoir is the calibration of an aluminium photocathode X-rays photoelectric detector, in the spectral range 0,5 keV - 1,5 KeV, with a continuous X-ray source. The detectors's calibration consist to measure the detector's sensitivity versus incident energy. In order to produce monochromatic incident beam on the detector, we used a multilayer mirror whose reflectivity was characterized. The measurements are compared to those realized in an other laboratory. (authors). 36 refs., 61 figs., 13 tabs., 2 photos

Compact x-ray microradiograph for in situ imaging of solidification processes: Bringing in situ x-ray micro-imaging from the synchrotron to the laboratory

Energy Technology Data Exchange (ETDEWEB)

Rakete, C.; Baumbach, C.; Goldschmidt, A.; Samberg, D.; Schroer, C. G. [Institut fuer Strukturphysik, Technische Universitaet Dresden, D-01062 Dresden (Germany); Breede, F.; Stenzel, C. [Astrium-Space Transportation, Department: TO 611, Claude-Dornier-Strasse, D-88039 Friedrichshafen (Germany); Zimmermann, G.; Pickmann, C. [ACCESS e.V., Intzestrasse 5, D-52072 Aachen (Germany); Houltz, Y.; Lockowandt, C. [Science Services Division, SSC, Box 4207, SE-17104 Solna (Sweden); Svenonius, O.; Wiklund, P. [Scint-X AB, Torshamnsgatan 35, SE-164 40 Kista (Sweden); Mathiesen, R. H. [Inst. for Fysikk, NTNU, N-7491 Trondheim (Norway)

2011-10-15

A laboratory based high resolution x-ray radiograph was developed for the investigation of solidification dynamics in alloys. It is based on a low-power microfocus x-ray tube and is potentially appropriate for x-ray diagnostics in space. The x-ray microscope offers a high spatial resolution down to approximately 5 {mu}m. Dynamic processes can be resolved with a frequency of up to 6 Hz. In reference experiments, the setup was optimized to yield a high contrast for AlCu-alloys. With samples of about 150 {mu}m thickness, high quality image sequences of the solidification process were obtained with high resolution in time and space.

Asian conference on x-rays and related techniques in research and industry. Proceedings

International Nuclear Information System (INIS)

1996-01-01

This proceedings compile the paper presented at the conference. The papers for presentation are from wide spectrum stressing the interdisciplinary nature of the conference i.e. x-ray fluorescence spectrometry (XRF), x-ray diffraction (XRD), TEM, scanning electron microscope (SEM), energy dispersive x-ray (EDX), auger electron microscopy, electron back scatter diffraction (EBSD)

X-ray holography. Atoms in three dimensions

International Nuclear Information System (INIS)

Tegze, M.

2005-01-01

The principles of atomic resolution X-ray holography was elaborated in 1991. X-ray photons scatter thousand times less on atoms than electrons of the same wavelength. As a result, both free path and penetration depth are higher which giver information about the bulk material. X-ray holography is realized by irradiating the single crystal sample with radiation from external X-ray source. The incident radiation is ionizing the atoms of the sample to emit fluorescent radiation. The angle dependence of the fluorescent radiation results an image containing the hologram. The hologram itself is extremely small compared to the background that needs 10 10 capturing photons to recover image. Using Thomas Gog's method and synchrotron radiation the X-ray holography becomes more usable, but the method still needs refining both experimentally and theoretically. (TRA)

X-Ray and Gamma-Ray Radiation Detector

DEFF Research Database (Denmark)

2015-01-01

Disclosed is a semiconductor radiation detector for detecting X-ray and / or gamma-ray radiation. The detector comprises a converter element for converting incident X-ray and gamma-ray photons into electron-hole pairs, at least one cathode, a plurality of detector electrodes arranged with a pitch...... (P) along a first axis, a plurality of drift electrodes, a readout circuitry being configured to read out signals from the plurality of detector electrodes and a processing unit connected to the readout circuitry and being configured to detect an event in the converter element. The readout circuitry...... is further configured to read out signals from the plurality of drift electrodes, and the processing unit is further configured to estimate a location of the event along the first axis by processing signals obtained from both the detector electrodes and the drift electrodes, the location of the event along...

An x-ray detector for time-resolved studies

International Nuclear Information System (INIS)

Rodricks, B.; Brizard, C.; Clarke, R.; Lowe, W.

1992-01-01

The development of ultrahigh-brightness x-ray sources makes time-resolved x-ray studies more and more feasible. Improvements in x-ray optics components are also critical for obtaining the appropriate beam for a particular type of experiment. Moreover, fast parallel detectors will be essential in order to exploit the combination of high intensity x-ray sources and novel optics for time-resolved experiments. A CCD detector with a time resolution of microseconds has been developed at the Advanced Photon Source (APS). This detector is fully programmable using CAMAC electronics and a Micro Vax computer. The techniques of time-resolved x-ray studies, which include scattering, microradiography, microtomography, stroboscopy, etc., can be applied to a range of phenomena (including rapid thermal annealing, surface ordering, crystallization, and the kinetics of phase transition) in order to understand these time-dependent microscopic processes. Some of these applications will be illustrated by recent results performed at synchrotrons. New powerful x-ray sources now under construction offer the opportunity to apply innovative approaches in time-resolved work

Time-resolved X-ray PIV technique for diagnosing opaque biofluid flow with insufficient X-ray fluxes.

Science.gov (United States)

Jung, Sung Yong; Park, Han Wook; Kim, Bo Heum; Lee, Sang Joon

2013-05-01

X-ray imaging is used to visualize the biofluid flow phenomena in a nondestructive manner. A technique currently used for quantitative visualization is X-ray particle image velocimetry (PIV). Although this technique provides a high spatial resolution (less than 10 µm), significant hemodynamic parameters are difficult to obtain under actual physiological conditions because of the limited temporal resolution of the technique, which in turn is due to the relatively long exposure time (~10 ms) involved in X-ray imaging. This study combines an image intensifier with a high-speed camera to reduce exposure time, thereby improving temporal resolution. The image intensifier amplifies light flux by emitting secondary electrons in the micro-channel plate. The increased incident light flux greatly reduces the exposure time (below 200 µs). The proposed X-ray PIV system was applied to high-speed blood flows in a tube, and the velocity field information was successfully obtained. The time-resolved X-ray PIV system can be employed to investigate blood flows at beamlines with insufficient X-ray fluxes under specific physiological conditions. This method facilitates understanding of the basic hemodynamic characteristics and pathological mechanism of cardiovascular diseases.

Instrumental fundamental parameters and selected applications of the microfocus X-ray fluorescence analysis at a scanning electron microscope; Instrumentelle Fundamentalparameter und ausgewaehlte Anwendungen der Mikrofokus-Roentgenfluoreszenzanalyse am Rasterelektronenmikroskop

Energy Technology Data Exchange (ETDEWEB)

Rackwitz, Vanessa

2012-05-30

For a decade X-ray sources have been commercially available for the microfocus X-ray fluorescence analysis ({mu}-XRF) and offer the possibility of extending the analytics at a scanning electron microscope (SEM) with an attached energy dispersive X-ray spectrometer (EDS). By using the {mu}-XRF it is possible to determine the content of chemical elements in a microscopic sample volume in a quantitative, reference-free and non-destructive way. For the reference-free quantification with the XRF the Sherman equation is referred to. This equation deduces the intensity of the detected X-ray intensity of a fluorescence peak to the content of the element in the sample by means of fundamental parameters. The instrumental fundamental parameters of the {mu}-XRF at a SEM/EDS system are the excitation spectrum consisting of X-ray tube spectrum and the transmission of the X-ray optics, the geometry and the spectrometer efficiency. Based on a calibrated instrumentation the objectives of this work are the development of procedures for the characterization of all instrumental fundamental parameters as well as the evaluation and reduction of their measurement uncertainties: The algorithms known from the literature for the calculation of X-ray tube spectrum are evaluated with regard to their deviations in the spectral distribution. Within this work a novel semi-empirical model is improved with respect to its uncertainties and enhanced in the low energy range as well as extended for another three anodes. The emitted X-ray tube spectrum is calculated from the detected one, which is measured at an especially developed setup for the direct measurement of X-ray tube spectra. This emitted X-ray tube spectrum is compared to the one calculated on base of the model of this work. A procedure for the determination of the most important parameters of an X-ray semi-lens in parallelizing mode is developed. The temporal stability of the transmission of X-ray full lenses, which have been in regular

Surface slope metrology of highly curved x-ray optics with an interferometric microscope

Science.gov (United States)

Gevorkyan, Gevork S.; Centers, Gary; Polonska, Kateryna S.; Nikitin, Sergey M.; Lacey, Ian; Yashchuk, Valeriy V.

2017-09-01

The development of deterministic polishing techniques has given rise to vendors that manufacture high quality threedimensional x-ray optics. The surface metrology on these optics remains a difficult task. For the fabrication, vendors usually use unique surface metrology tools, generally developed on site, that are not available in the optical metrology labs at x-ray facilities. At the Advanced Light Source X-Ray Optics Laboratory, we have developed a rather straightforward interferometric-microscopy-based procedure capable of sub microradian characterization of sagittal slope variation of x-ray optics for two-dimensionally focusing and collimating (such as ellipsoids, paraboloids, etc.). In the paper, we provide the mathematical foundation of the procedure and describe the related instrument calibration. We also present analytical expression describing the ideal surface shape in the sagittal direction of a spheroid specified by the conjugate parameters of the optic's beamline application. The expression is useful when analyzing data obtained with such optics. The high efficiency of the developed measurement and data analysis procedures is demonstrated in results of measurements with a number of x-ray optics with sagittal radius of curvature between 56 mm and 480 mm. We also discuss potential areas of further improvement.

Molecular aggregation states of poly{2-(perfluorooctyl)ethyl acrylate} polymer brush thin film analyzed by grazing incidence X-ray diffraction

International Nuclear Information System (INIS)

Yamaguchi, H; Honda, K; Takahara, A; Kobayashi, M; Morita, M; Masunaga, H; Sasaki, S; Takata, M; Sakata, O

2009-01-01

Fluoropolymer brush with crystalline side chains was prepared by surface-initiated atom transfer radical polymerization of 2-(perfluorooctyl)ethyl acrylate (FA-C 8 ) from a flat silicon substrate. The crystallization and the molecular aggregation structures of polymer side chain at the outermost surface and internal region in the brush film were characterized by grazing incidence X-ray diffraction (GIXD) measurement using two different incident angles of X-ray. At the air interface of PFA-C 8 brush film, the rod-like R f group was oriented perpendicular to the surface forming a hexagonal packing structure to reduce surface energy. In contrast, the oriented R f groups parallel to the substrate coexisted at the internal region in the brush. This unique depth dependence of crystalline state of the fluoropolymer brush was observed by surface-sensitive GIXD measurement.

Soft X-rays from the sunlit earth's atmosphere

International Nuclear Information System (INIS)

McKenzie, D.L.; Rugge, H.R.; Charles, P.A.

1982-01-01

The HEAO-1 A-2 experiment low energy proportional counters have been used to measure the X-ray spectrum of the sunlit earth in the energy range 0.2 to 0.8 keV. The X-rays arise by coherent scattering of, or fluorescence of atmospheric constituents by, solar coronal X-rays incident on the atmosphere. Although the relative spectral contributions of the two processes depend upon the sun-earth-satellite geometry, fluorescent oxygen and nitrogen K X-ray emission is always important. The observed spectra were compared with calculations in order to derive the coronal temperature and emission measure, parameters that characterize the incident solar spectrum. These derived parameters agree well with the expected values for the nonflaring sun, and good agreement was obtained between measurements closely spaced in time but having a wide range of geometries and counting rates. Thus X-ray observations of the sunlit earth's atmosphere can be a useful monitor of solar activity for satellite-borne instrumentation unable to view the sun directly. The total measured fluorescent line flux agreed well with calculations, but the N:O line ratio did not. This disagreement is attributed to several causes which are discussed. (author)

Hybrid setup for micro- and nano-computed tomography in the hard X-ray range

Science.gov (United States)

Fella, Christian; Balles, Andreas; Hanke, Randolf; Last, Arndt; Zabler, Simon

2017-12-01

With increasing miniaturization in industry and medical technology, non-destructive testing techniques are an area of ever-increasing importance. In this framework, X-ray microscopy offers an efficient tool for the analysis, understanding, and quality assurance of microscopic samples, in particular as it allows reconstructing three-dimensional data sets of the whole sample's volume via computed tomography (CT). The following article describes a compact X-ray microscope in the hard X-ray regime around 9 keV, based on a highly brilliant liquid-metal-jet source. In comparison to commercially available instruments, it is a hybrid that works in two different modes. The first one is a micro-CT mode without optics, which uses a high-resolution detector to allow scans of samples in the millimeter range with a resolution of 1 μm. The second mode is a microscope, which contains an X-ray optical element to magnify the sample and allows resolving 150 nm features. Changing between the modes is possible without moving the sample. Thus, the instrument represents an important step towards establishing high-resolution laboratory-based multi-mode X-ray microscopy as a standard investigation method.

Development of a plasma system as a source of radiation for X-ray microscopy

International Nuclear Information System (INIS)

Neff, W.; Lebert, R.; Holz, R.

1992-01-01

During the period of the report, an X-ray source was developed for a laboratory X-ray microscope based on a plasma focus. Nitrogen is used as the discharge gas. The Lyman α line (λ = 2.48 nm) of nitrogen ions N VII similar to hydrogen is used for the image in the microscope. This line is favourably situated at the start of the water window (2.33 - 4.37 nm), so that the microscope is particularly suitable for the examination of biological objects. (orig.) [de

Miniaturized High-Speed Modulated X-Ray Source

Science.gov (United States)

Gendreau, Keith C. (Inventor); Arzoumanian, Zaven (Inventor); Kenyon, Steven J. (Inventor); Spartana, Nick Salvatore (Inventor)

2015-01-01

A miniaturized high-speed modulated X-ray source (MXS) device and a method for rapidly and arbitrarily varying with time the output X-ray photon intensities and energies. The MXS device includes an ultraviolet emitter that emits ultraviolet light, a photocathode operably coupled to the ultraviolet light-emitting diode that emits electrons, an electron multiplier operably coupled to the photocathode that multiplies incident electrons, and an anode operably coupled to the electron multiplier that is configured to produce X-rays. The method for modulating MXS includes modulating an intensity of an ultraviolet emitter to emit ultraviolet light, generating electrons in response to the ultraviolet light, multiplying the electrons to become more electrons, and producing X-rays by an anode that includes a target material configured to produce X-rays in response to impact of the more electrons.

A new Scanning Transmission X-ray Microscope at the ALS for operation up to 2500eV

International Nuclear Information System (INIS)

Kilcoyne, David; Ade, Harald; Attwood, David; Hitchcock, Adam; McKean, Pat; Mitchell, Gary; Monteiro, Paulo; Tyliszczak, Tolek; Warwick, Tony

2010-01-01

We report on the design and construction of a higher energy Scanning Transmission X-ray Microscope on a new bend magnet beam line at the Advanced Light Source. Previously we have operated such an instrument on a bend magnet for C, N and O 1s NEXAFS spectroscopy. The new instrument will have similar performance at higher energies up to and including the S 1s edge at 2472eV. A new microscope configuration is planned. A more open geometry will allow a fluorescence detector to count emitted photons from the front surface of the sample. There will be a capability for zone plate scanning in addition to the more conventional sample scanning mode. This will add the capability for imaging a massive sample at high resolution over a limited field of view, so that heavy reaction cells may be used to study processes in-situ, exploiting the longer photon attenuation length and the longer zone plate working distances available at higher photon energy. The energy range will extend down to include the C1s edge at 300eV, to allow high energy NEXAFS microscopic studies to correlate with the imaging of organics in the same sample region of interest.

X-radiation damage of hydrated lecithin membranes detected by real-time X-ray diffraction using wiggler-enhanced synchrotron radiation as the ionizing radiation source

International Nuclear Information System (INIS)

Caffrey, M.; Cornell Univ., Ithaca, NY

1984-01-01

Radiation damage of hydrated lecithin membranes brought about by exposure to wiggler-derived synchrotron radiation at 8.3 keV (1.5 A) is reported. Considerable damage was observed with exposures under 1 h at an incident flux density of 3 x 10 10 photons s -1 mm -2 , corresponding to a cumulative radiation dose of <= 10 MRad. Damage was so dramatic as to be initially observed while making real-time X-ray diffraction measurements on the sample. The damaging effects of 8.3 keV X-rays on dispersions of dipalmitoyllecithin and lecithin derived from hen egg yolk are as follows: (1) marked changes were noted in the X-ray diffraction behaviour, indicating disruption of membrane stacking. (2) Chemical breakdown of lecithin was observed. (3) The X-ray beam visibly damaged the sample and changed the appearance of the lipid dispersion, when viewed under the light microscope. Considering the importance of X-ray diffraction as a structural probe and the anticipated use of synchrotron radiation in studies involving membranes, the problem of radiation damage must be duly recognized. Furthermore, since dipalmitoyllecithin, the major lipid used in the present study, is a relatively stable compound, it is not unreasonable to expect that X-ray damage may be a problem with other less stable biological and non-biological materials. These results serve to emphasize that whenever a high intensity X-ray source is used, radiation damage can be a problem and that the sensitivity of the sample must always be evaluated under the conditions of measurement. (orig.)

X-ray Optics Development at MSFC

Science.gov (United States)

Sharma, Dharma P.

2017-01-01

Development of high resolution focusing telescopes has led to a tremendous leap in sensitivity, revolutionizing observational X-ray astronomy. High sensitivity and high spatial resolution X-ray observations have been possible due to use of grazing incidence optics (paraboloid/hyperboloid) coupled with high spatial resolution and high efficiency detectors/imagers. The best X-ray telescope flown so far is mounted onboard Chandra observatory launched on July 23,1999. The telescope has a spatial resolution of 0.5 arc seconds with compatible imaging instruments in the energy range of 0.1 to 10 keV. The Chandra observatory has been responsible for a large number of discoveries and has provided X-ray insights on a large number of celestial objects including stars, supernova remnants, pulsars, magnetars, black holes, active galactic nuclei, galaxies, clusters and our own solar system.

Unsupervised Data Mining in nanoscale X-ray Spectro-Microscopic Study of NdFeB Magnet.

Science.gov (United States)

Duan, Xiaoyue; Yang, Feifei; Antono, Erin; Yang, Wenge; Pianetta, Piero; Ermon, Stefano; Mehta, Apurva; Liu, Yijin

2016-09-29

Novel developments in X-ray based spectro-microscopic characterization techniques have increased the rate of acquisition of spatially resolved spectroscopic data by several orders of magnitude over what was possible a few years ago. This accelerated data acquisition, with high spatial resolution at nanoscale and sensitivity to subtle differences in chemistry and atomic structure, provides a unique opportunity to investigate hierarchically complex and structurally heterogeneous systems found in functional devices and materials systems. However, handling and analyzing the large volume data generated poses significant challenges. Here we apply an unsupervised data-mining algorithm known as DBSCAN to study a rare-earth element based permanent magnet material, Nd 2 Fe 14 B. We are able to reduce a large spectro-microscopic dataset of over 300,000 spectra to 3, preserving much of the underlying information. Scientists can easily and quickly analyze in detail three characteristic spectra. Our approach can rapidly provide a concise representation of a large and complex dataset to materials scientists and chemists. For example, it shows that the surface of common Nd 2 Fe 14 B magnet is chemically and structurally very different from the bulk, suggesting a possible surface alteration effect possibly due to the corrosion, which could affect the material's overall properties.

Unsupervised Data Mining in nanoscale X-ray Spectro-Microscopic Study of NdFeB Magnet

Science.gov (United States)

Duan, Xiaoyue; Yang, Feifei; Antono, Erin; Yang, Wenge; Pianetta, Piero; Ermon, Stefano; Mehta, Apurva; Liu, Yijin

2016-09-01

Novel developments in X-ray based spectro-microscopic characterization techniques have increased the rate of acquisition of spatially resolved spectroscopic data by several orders of magnitude over what was possible a few years ago. This accelerated data acquisition, with high spatial resolution at nanoscale and sensitivity to subtle differences in chemistry and atomic structure, provides a unique opportunity to investigate hierarchically complex and structurally heterogeneous systems found in functional devices and materials systems. However, handling and analyzing the large volume data generated poses significant challenges. Here we apply an unsupervised data-mining algorithm known as DBSCAN to study a rare-earth element based permanent magnet material, Nd2Fe14B. We are able to reduce a large spectro-microscopic dataset of over 300,000 spectra to 3, preserving much of the underlying information. Scientists can easily and quickly analyze in detail three characteristic spectra. Our approach can rapidly provide a concise representation of a large and complex dataset to materials scientists and chemists. For example, it shows that the surface of common Nd2Fe14B magnet is chemically and structurally very different from the bulk, suggesting a possible surface alteration effect possibly due to the corrosion, which could affect the material’s overall properties.

Dissecting Diffuse X-ray Emission in 30 Doradus with T-ReX

Science.gov (United States)

Townsley, Leisa K.; Broos, Patrick

2017-08-01

30 Doradus (the Tarantula Nebula) offers us a microscope on starburst astrophysics, having endured 25 Myrs of the birth and death of the most massive stars known. Across 30 Dor's 250-pc extent, stellar winds and supernovae have carved its ISM into an amazing display of arcs, pillars, and bubbles. For over 40 years, we have also known that 30 Dor is a bright X-ray emitter, so its familiar stars and cold ISM structures suffer irradiation by multi-million-degree plasmas. The 2-Ms Chandra X-ray Visionary Project ``The Tarantula -- Revealed by X-rays'' (T-ReX) exploits Chandra's fine spatial resolution and the ACIS-I field of view to study ISM interfaces on 1--10 pc scales across the entire 30 Dor complex. Here we give preliminary results from ongoing analyses of these data, focusing on the diffuse X-ray emission. Massive star winds and cavity supernovae over the millenia have contributed to a broad mix of X-ray-emitting plasmas and absorbing columns, showing that 30 Dor's hot ISM is just as complex and confusing as that seen at colder temperatures.

Scattering of x rays from low-Z materials

International Nuclear Information System (INIS)

Gaines, J.L.; Kissel, L.D.; Catron, H.C.; Hansen, R.A.

1980-01-01

X rays incident on thin beryllium, boron, carbon, and other low-Z materials undergo both elastic and inelastic scattering as well as diffraction from the crystalline or crystalline-like structure of the material. Unpolarized monoenergetic x rays in the 1.5 to 8.0-keV energy range were used to determine the absolute scattering efficiency of thin beryllium, carbon, and boron foils. These measurements are compared to calculated scattering efficiencies predicted by single-atom theories. In addition, the relative scattering efficiency versus x-ray energy was measured for other low-Z foils using unpolarized bremsstrahlung x rays. In all the low-Z foils examined, we observed Bragg-like x-ray diffraction due to the ordered structure of the materials

Local X-ray magnetic circular dichroism study of Fe/Cu(111) using a tunneling smart tip

Energy Technology Data Exchange (ETDEWEB)

DiLullo, Andrew; Shirato, Nozomi; Cummings, Marvin [Argonne National Laboratory, 9700 South Cass Avenue, Argonne, IL 60439 (United States); Kersell, Heath; Chang, Hao [Argonne National Laboratory, 9700 South Cass Avenue, Argonne, IL 60439 (United States); Ohio University, Athens, OH 45701 (United States); Rosenmann, Daniel; Miller, Dean; Freeland, John W. [Argonne National Laboratory, 9700 South Cass Avenue, Argonne, IL 60439 (United States); Hla, Saw-Wai [Argonne National Laboratory, 9700 South Cass Avenue, Argonne, IL 60439 (United States); Ohio University, Athens, OH 45701 (United States); Rose, Volker, E-mail: vrose@anl.gov [Argonne National Laboratory, 9700 South Cass Avenue, Argonne, IL 60439 (United States); Argonne National Laboratory, 9700 South Cass Avenue, Argonne, IL 60439 (United States)

2016-01-28

A tunneling smart tip of a synchrotron X-ray scanning tunneling microscope provides simultaneously localized topographic, elemental and magnetic information. Localized spectroscopy with simultaneous topographic, elemental and magnetic information is presented. A synchrotron X-ray scanning tunneling microscope has been employed for the local study of the X-ray magnetic circular dichroism at the Fe L{sub 2,3}-edges of a thin iron film grown on Cu(111). Polarization-dependent X-ray absorption spectra have been obtained through a tunneling smart tip that serves as a photoelectron detector. In contrast to conventional spin-polarized scanning tunneling microscopy, X-ray excitations provide magnetic contrast even with a non-magnetic tip. Intensity variations in the photoexcited tip current point to chemical variations within a single magnetic Fe domain.

Correlating properties and microstructure of YBCO thin films by magnetic X-ray microscopy

Energy Technology Data Exchange (ETDEWEB)

Ruoss, Stephen; Stahl, Claudia; Weigand, Markus; Schuetz, Gisela [Max-Planck-Institute for Intelligent Systems, Heisenbergstrasse 3, 70569 Stuttgart (Germany); Zahn, Patrick; Bayer, Jonas [Max-Planck-Institute for Intelligent Systems, Heisenbergstrasse 3, 70569 Stuttgart (Germany); Research Institute for Innovative Surfaces, FINO, Aalen University, Beethovenstrasse 1, 73430 Aalen (Germany); Albrecht, Joachim [Research Institute for Innovative Surfaces, FINO, Aalen University, Beethovenstrasse 1, 73430 Aalen (Germany)

2016-07-01

The magnetic flux distribution in high-temperature superconductors namely YBCO has been observed using a novel high-resolution technique based on the X-ray magnetic circular dichroism (XMCD). Therefore, a CoFeB layer is deposited on the superconductor which exhibits a strong XMCD-effect. X-ray absorption measurements with circular polarized radiation allows the analysis of the magnetic flux distribution in the superconductor via the soft-magnetic sensor layer [3,4]. In the total electron yield (TEY) mode of the scanning X-ray microscope (SXM) the surface structure and the magnetic domains can be imaged at the same time. Having obtained such high resolution images, the correlation of magnetic flux penetration and defect structure of YBCO thin films can be analyzed. The measurements have been performed at the scanning X-ray microscope MAXYMUS at Bessy II, HZB Berlin.

Experimental elucidation: microscopic mechanism of resonant X-ray scattering in manganite films

CERN Document Server

Ohsumi, H; Kiyama, T

2003-01-01

Resonant X-ray scattering experiments have been performed on perovskite manganite La sub 0 sub . sub 5 Sr sub 0 sub . sub 5 MnO sub 3 thin films, which are grown on three distinct perovskite with a coherent epitaxial strain and have a forced ferro-type orbital ordering of Mn 3d orbitals. Using an interference technique, we have successfully observed the resonant X-ray scattering signal from the system having the ferro-type orbital ordering and also revealed the energy scheme of Mn 4p bands. For the forced ferro-type orbital ordering system, the present results evidence that the resonant X-ray scattering signal originates from the band structure effect due to the Jahn-Teller distortion of a MnO sub 6 octahedron, and not from the Coulomb interaction between 3d and 4p electrons. (author)

Marshall Grazing Incidence X-ray Spectrometer (MaGIXS) Slit-Jaw Imaging System

Science.gov (United States)

Wilkerson, P.; Champey, P. R.; Winebarger, A. R.; Kobayashi, K.; Savage, S. L.

2017-12-01

The Marshall Grazing Incidence X-ray Spectrometer is a NASA sounding rocket payload providing a 0.6 - 2.5 nm spectrum with unprecedented spatial and spectral resolution. The instrument is comprised of a novel optical design, featuring a Wolter1 grazing incidence telescope, which produces a focused solar image on a slit plate, an identical pair of stigmatic optics, a planar diffraction grating and a low-noise detector. When MaGIXS flies on a suborbital launch in 2019, a slit-jaw camera system will reimage the focal plane of the telescope providing a reference for pointing the telescope on the solar disk and aligning the data to supporting observations from satellites and other rockets. The telescope focuses the X-ray and EUV image of the sun onto a plate covered with a phosphor coating that absorbs EUV photons, which then fluoresces in visible light. This 10-week REU project was aimed at optimizing an off-axis mounted camera with 600-line resolution NTSC video for extremely low light imaging of the slit plate. Radiometric calculations indicate an intensity of less than 1 lux at the slit jaw plane, which set the requirement for camera sensitivity. We selected a Watec 910DB EIA charge-coupled device (CCD) monochrome camera, which has a manufacturer quoted sensitivity of 0.0001 lux at F1.2. A high magnification and low distortion lens was then identified to image the slit jaw plane from a distance of approximately 10 cm. With the selected CCD camera, tests show that at extreme low-light levels, we achieve a higher resolution than expected, with only a moderate drop in frame rate. Based on sounding rocket flight heritage, the launch vehicle attitude control system is known to stabilize the instrument pointing such that jitter does not degrade video quality for context imaging. Future steps towards implementation of the imaging system will include ruggedizing the flight camera housing and mounting the selected camera and lens combination to the instrument structure.

X-ray emission from plasmas created by smoothed KrF laser irradiation

International Nuclear Information System (INIS)

Aglitskiy, Y.; Lehecka, T.; Deniz, A.; Hardgrove, J.; Seely, J.; Brown, C.; Feldman, U.; Pawley, C.; Gerber, K.; Bodner, S.; Obenschain, S.; Lehmberg, R.; McLean, E.; Pronko, M.; Sethian, J.; Stamper, J.; Schmitt, A.; Sullivan, C.; Holland, G.; Laming, M.

1996-01-01

The x-ray emission from plasmas created by the Naval Research Laboratory Nike KrF laser [Phys. Plasmas 3, 2098 (1996) ] was characterized using imaging and spectroscopic instruments. The laser wavelength was 1/4 μm, and the beams were smoothed by induced spatial incoherence (ISI). The targets were thin foils of CH, aluminum, titanium, and cobalt and were irradiated by laser energies in the range 100 endash 1500 J. A multilayer mirror microscope operating at an energy of 95 eV recorded images of the plasma with a spatial resolution of 2 μm. The variation of the 95 eV emission across the 800 μm focal spot was 1.3% rms. Using a curved crystal imager operating in the 1 endash 2 keV x-ray region, the density, temperature, and opacity of aluminum plasmas were determined with a spatial resolution of 10 μm perpendicular to the target surface. The spectral line ratios indicated that the aluminum plasmas were relatively dense, cool, and optically thick near the target surface. The absolute radiation flux was determined at 95 eV and in x-ray bandpasses covering the 1 endash 8 keV region. The electron temperature inferred from the slope of the x-ray flux versus energy data in the 5 endash 8 keV region was 900 eV for an incident laser energy of 200 J and an intensity of ≅10 13 W/cm 2

X-ray focusing with Wolter microchannel plate optics

CERN Document Server

Price, G J; Beijersbergen, M W; Fraser, G W; Bavdaz, M; Boutot, J P; Fairbend, R; Flyckt, S O; Peacock, A; Tomaselli, E

2002-01-01

Square-pore microchannel plate (MCP) X-ray optics of the 'lobster-eye' geometry have frequently been described in the literature. We have now investigated the use of a radial channel packing geometry which, in the context of an MCP pair slumped to the correct radii of curvature, can form a conic approximation to the Wolter Type I grazing incidence X-ray optic. Such an optic can provide a large effective area with very low mass and may be ideally suited for use in applications such as planetary imaging X-ray fluorescence. We present here the results of X-ray illumination of the first such optic, fabricated by Photonis SAS, France.

Grazing incidence X-ray absorption characterization of amorphous Zn-Sn-O thin film

Science.gov (United States)

Moffitt, S. L.; Ma, Q.; Buchholz, D. B.; Chang, R. P. H.; Bedzyk, M. J.; Mason, T. O.

2016-05-01

We report a surface structure study of an amorphous Zn-Sn-O (a-ZTO) transparent conducting film using the grazing incidence X-ray absorption spectroscopy technique. By setting the measuring angles far below the critical angle at which the total external reflection occurs, the details of the surface structure of a film or bulk can be successfully accessed. The results show that unlike in the film where Zn is severely under coordinated (N < 4), it is fully coordinated (N = 4) near the surface while the coordination number around Sn is slightly smaller near the surface than in the film. Despite a 30% Zn doping, the local structure in the film is rutile-like.

Observation of X-ray shadings in synchrotron radiation-total reflection X-ray fluorescence using a color X-ray camera

Energy Technology Data Exchange (ETDEWEB)

Fittschen, Ursula Elisabeth Adriane, E-mail: ursula.fittschen@chemie.uni-hamburg.de [Institut für Anorganische und Angewandte Chemie, Universität Hamburg, Martin-Luther-King-Platz 6, 20146 Hamburg (Germany); Menzel, Magnus [Institut für Anorganische und Angewandte Chemie, Universität Hamburg, Martin-Luther-King-Platz 6, 20146 Hamburg (Germany); Scharf, Oliver [IfG Institute for Scientific Instruments GmbH, Berlin (Germany); Radtke, Martin; Reinholz, Uwe; Buzanich, Günther [BAM Federal Institute of Materials Research and Testing, Berlin (Germany); Lopez, Velma M.; McIntosh, Kathryn [Los Alamos National Laboratory, Los Alamos, NM (United States); Streli, Christina [Atominstitut, TU Wien, Vienna (Austria); Havrilla, George Joseph [Los Alamos National Laboratory, Los Alamos, NM (United States)

2014-09-01

Absorption effects and the impact of specimen shape on TXRF analysis has been discussed intensively. Model calculations indicated that ring shaped specimens should give better results in terms of higher counts per mass signals than filled rectangle or circle shaped specimens. One major reason for the difference in signal is shading effects. Full field micro-XRF with a color X-ray camera (CXC) was used to investigate shading, which occurs when working with small angles of excitation as in TXRF. The device allows monitoring the illuminated parts of the sample and the shaded parts at the same time. It is expected that sample material hit first by the primary beam shade material behind it. Using the CXC shading could be directly visualized for the high concentration specimens. In order to compare the experimental results with calculation of the shading effect the generation of controlled specimens is crucial. This was achieved by “drop on demand” technology. It allows generating uniform, microscopic deposits of elements. The experimentally measured shadings match well with those expected from calculation. - Highlights: • Use of a color X-ray camera and drop on demand printing to diagnose X-ray shading • Specimens were obtained uniform and well-defined in shape and concentration by printing. • Direct visualization and determination of shading in such specimens using the camera.

Observation of X-ray shadings in synchrotron radiation-total reflection X-ray fluorescence using a color X-ray camera

International Nuclear Information System (INIS)

Fittschen, Ursula Elisabeth Adriane; Menzel, Magnus; Scharf, Oliver; Radtke, Martin; Reinholz, Uwe; Buzanich, Günther; Lopez, Velma M.; McIntosh, Kathryn; Streli, Christina; Havrilla, George Joseph

2014-01-01

Absorption effects and the impact of specimen shape on TXRF analysis has been discussed intensively. Model calculations indicated that ring shaped specimens should give better results in terms of higher counts per mass signals than filled rectangle or circle shaped specimens. One major reason for the difference in signal is shading effects. Full field micro-XRF with a color X-ray camera (CXC) was used to investigate shading, which occurs when working with small angles of excitation as in TXRF. The device allows monitoring the illuminated parts of the sample and the shaded parts at the same time. It is expected that sample material hit first by the primary beam shade material behind it. Using the CXC shading could be directly visualized for the high concentration specimens. In order to compare the experimental results with calculation of the shading effect the generation of controlled specimens is crucial. This was achieved by “drop on demand” technology. It allows generating uniform, microscopic deposits of elements. The experimentally measured shadings match well with those expected from calculation. - Highlights: • Use of a color X-ray camera and drop on demand printing to diagnose X-ray shading • Specimens were obtained uniform and well-defined in shape and concentration by printing. • Direct visualization and determination of shading in such specimens using the camera

Guiding hard x rays with glass polycapillary fiber

International Nuclear Information System (INIS)

Xiao, Q.F.; Ponomarev, I.Y.; Kolomitsev, A.I.; Gibson, D.M.; Dilmanian, F.A.; Nachaliel, E.

1993-01-01

X rays can be guided through a polycapillary fiber by multiple total reflections from the smooth channel walls of the fiber. Using monochromatic Synchrotron Radiation at energies of 22 and 44 keV, we measured the efficiency of transmission of x rays through polycapillary fibers with channel diameters of about 13 μm. Efficiencies of 57.3% and 54.5% for 22 keV and 44 keV x rays, respectively, were obtained with a 120-mm-long straight polycapillary fiber aligned with the incident beam. These values are close to the open fraction of the fiber, which is about 60%. In addition, transmission efficiency was measured as a function of the tilt angle between the incident beam and the axis of the fiber. We also measured the transmission efficiency as a function of the deflection angle for a 114-mm-long curved polycapillary fiber. The measurements are compared with a ray-tracing simulation

X-ray optical diagnostic of laser produced plasmas for nuclear fusion and X-ray lasers

Energy Technology Data Exchange (ETDEWEB)

Butzbach, R.

2001-07-01

In the present work, the conception, design and appliance of toroidally bent crystals for the X-ray optical diagnostics of laser produced plasmas is discussed. The first part of this work deals with the development, design and characterization of an X-Ray microscope for the observation of Rayleigh-Taylor instabilities, which act against the confinement and ignition of the fuel in the inertial confinement fusion process. The aim of the second part of the present work was the diagnostic of the lasing medium for amplified spontaneous emission close to the water window. For this purpose, an one-dimensionally (1-D) imaging X-ray spectrometer based on toroidally bent quartz crystals was developed for the observation of the Ni-like 4f-3d transition of Yb, Hf, Ta, and W ions, which should be related to the amplified 4d-4p emission, since the 4f niveau is very close to the 4d niveau. Thus, the 4f-3d transition can serve as an indicator for the population of the 4d niveau. (orig.)

Simulation study of two-energy X-ray fluorescence holograms reconstruction algorithm to remove twin images

International Nuclear Information System (INIS)

Xie Honglan; Hu Wen; Luo Hongxin; Deng Biao; Du Guohao; Xue Yanling; Chen Rongchang; Shi Shaomeng; Xiao Tiqiao

2008-01-01

Unlike traditional outside-source holography, X-ray fluorescence holography is carded out with fluorescent atoms in a sample as source light for holographic imaging. With the method, three-dimensional arrangement of atoms into crystals can be observed obviously. However, just like traditional outside-source holography, X-ray fluorescence holography suffers from the inherent twin-image problem, too. With a 27-Fe-atoms cubic lattice as model, we discuss in this paper influence of the photon energy of incident source in removing twin images in reconstructed atomic images by numerical simulation and reconstruction with two-energy X-ray fluorescence holography. The results indicate that incident X-rays of nearer energies have better effect of removing twin images. In the detector of X-ray holography, minimum difference of the two incident energies depends on energy resolution of the monochromator and detector, and for inside source X-ray holography, minimum difference of the two incident energies depends on difference of two neighboring fluorescent energies emitting from the element and energy resolution of detector. The spatial resolution of atomic images increases with the incident energies. This is important for experiments of X-ray fluorescence holography, which is being developed on Shanghai Synchrotron Radiation Facility. (authors)

X ray reflection masks: Manufacturing, characterization and first tests

Science.gov (United States)

Rahn, Stephen

1992-09-01

SXPL (Soft X-ray Projection Lithography) multilayer mirrors are characterized, laterally structured and then used as reflection masks in a projecting lithography procedure. Mo/Si-multilayer mirrors with a 2d in the region of 14 nm were characterized by Cu-k(alpha) grazing incidence as well as soft X-ray normal incidence reflectivity measurements. The multilayer mirrors were patterned by reactive ion etching with CF4 using a photoresist as etch mask, thus producing X-ray reflection masks. The masks were tested at the synchrotron radiation laboratory of the electron accelerator ELSA. A double crystal X-ray monochromator was modified so as to allow about 0.5 sq cm of the reflection mask to be illuminated by white synchrotron radiation. The reflected patterns were projected (with an energy of 100 eV) onto a resist and structure sizes down to 8 micrometers were nicely reproduced. Smaller structures were distorted by Fresnel-diffraction. The theoretically calculated diffraction images agree very well with the observed images.

Surface and interface strains studied by x-ray diffraction

International Nuclear Information System (INIS)

Akimoto, Koichi; Emoto, Takashi; Ichimiya, Ayahiko

1998-01-01

The authors have developed a technique of X-ray diffraction in order to measure strain fields near semiconductor surface and interface. The diffraction geometry is using the extremely asymmetric Bragg-case bulk reflection of a small incident angle to the surface and a large angle exiting from the surface. The incident angle of the X-rays is set near critical angle of total reflection by tuning X-ray energy of synchrotron radiation at the Photon Factory, Japan. For thermally grown-silicon oxide/Si(100) interface, the X-ray intensity of the silicon substrate 311 reflection has been measured. From comparison of the full width at half maxima (FWHM) of X-ray rocking curves of various thickness of silicon oxides, it has been revealed that silicon substrate lattice is highly strained in the thin (less than about 5 nm) silicon oxide/silicon system. In order to know the original silicon surface strain, the authors have also performed the same kind of measurements in the ultra-high vacuum chamber. A clean Si(111) 7x7 surface gives sharper X-ray diffraction peak than that of the native oxide/Si(111) system. From these measurements, it is concluded that the thin silicon oxide film itself gives strong strain fields to the silicon substrates, which may be the reason of the existence of the structural transition layer at the silicon oxide/Si interface

High spatial resolution soft-x-ray microscopy

Energy Technology Data Exchange (ETDEWEB)

Meyer-Ilse, W.; Medecki, H.; Brown, J.T. [Ernest Orlando Lawrence Berkeley National Lab., CA (United States)] [and others

1997-04-01

A new soft x-ray microscope (XM-1) with high spatial resolution has been constructed by the Center for X-ray Optics. It uses bending magnet radiation from beamline 6.1 at the Advanced Light Source, and is used in a variety of projects and applications in the life and physical sciences. Most of these projects are ongoing. The instrument uses zone plate lenses and achieves a resolution of 43 nm, measured over 10% to 90% intensity with a knife edge test sample. X-ray microscopy permits the imaging of relatively thick samples, up to 10 {mu}m thick, in water. XM-1 has an easy to use interface, that utilizes visible light microscopy to precisely position and focus the specimen. The authors describe applications of this device in the biological sciences, as well as in studying industrial applications including structured polymer samples.

X-ray absorption anisotropy for polychromatic illumination-Crystal views from inside

International Nuclear Information System (INIS)

Korecki, P.; Tolkiehn, M.; Novikov, D.V.

2009-01-01

We review an atomic resolution imaging method based on the analysis of the fine structure in X-ray absorption anisotropy, which results from incident beam diffraction. For a polychromatic X-ray beam, due to the suppression of higher order diffraction fringes, X-ray absorption anisotropy patterns can be interpreted as distorted real-space projections of the atomic structure around absorbing atoms. A qualitative method for analysis of X-ray absorption anisotropy patterns is presented, based on modeling of X-ray patterns with ray-traced images calculated for clusters around absorbing atoms.

Measuring helium bubble diameter distributions in tungsten with grazing incidence small angle x-ray scattering (GISAXS)

Science.gov (United States)

Thompson, M.; Kluth, P.; Doerner, R. P.; Kirby, N.; Riley, D.; Corr, C. S.

2016-02-01

Grazing incidence small angle x-ray scattering was performed on tungsten samples exposed to helium plasma in the MAGPIE and Pisces-A linear plasma devices to measure the size distributions of resulting helium nano-bubbles. Nano-bubbles were fitted assuming spheroidal particles and an exponential diameter distribution. These particles had mean diameters between 0.36 and 0.62 nm. Pisces-A exposed samples showed more complex patterns, which may suggest the formation of faceted nano-bubbles or nano-scale surface structures.

Using x-ray microprobes for environmental research

International Nuclear Information System (INIS)

Cai, Z.; Jastrow, J.; Kemner, K. M.; Lai, B.; Lee, H.-R.; Legnini, D. G.; Miller, R. M.; Pratt, S. T.; Rodrigues, W.; Yun, W.

1998-01-01

Understanding the fate of environmental contaminants is of fundamental importance in the development and evaluation of effective remediation strategies. Among the factors influencing the transport of these contaminants are the chemical speciation of the sample and the chemical and physical attributes of the surrounding medium. Characterization of the spatial distribution and chemical speciation at micron and submicron resolution is essential for studying the microscopic physical, geological, chemical, and biological interfaces that play a crucial role in determining contaminant fate and mobility. Hard X-ray spectroscopy and imaging are powerful techniques for the element-specific investigation of complex environmental samples at the needed micron and submicron resolution. An important advantage of these techniques results from the large penetration depth of hard X-rays in water. This minimizes the requirements for sample preparation and allows the detailed study of hydrated samples. This paper discusses some current problems in environmental science that can be addressed by using synchrotron-based X-ray imaging and spectroscopy. These concepts are illustrated by the results of recent X-ray microscopy studies at the Advanced Photon Source

X-rays and photocarcinogenesis in hairless mice.

Science.gov (United States)

Lerche, Catharina M; Philipsen, Peter A; Wulf, Hans Christian

2013-08-01

It is well known that excessive X-ray radiation can cause non-melanoma skin cancers. With the increased incidence of sun-related skin cancer there is a need to investigate the combination of sunlight and X-rays. Immunocompetent C3.Cg/TifBomTac mice (n = 298) were divided into 12 groups. Mice were irradiated with 12, 29 or 50 kV X-rays. The mice received a total dose of 45 Gy. They were irradiated with 3 SED simulated solar radiation (SSR) either before or after irradiation with X-rays. The groups irradiated with X-rays alone, 0, 3, 9 and 10 mice (0, 12, 29 and 50 kV, respectively) developed squamous cell carcinoma. In the groups irradiated with SSR after X-rays the development of tumours was significantly faster in the 50 kV group than in the corresponding control group (175 vs. 194 days, p X-ray radiation the development of tumours was significantly faster in the 29 and the 50 kV groups than in the corresponding control group (175 vs. 202 days, p X-ray radiation alone is a weak carcinogen in hairless mice. There is an added carcinogenic effect if X-ray radiation is given on prior sun-exposed skin or if the skin is sun-exposed after X-rays. We still believe that X-ray radiation is a safe and effective therapy for various dermatological diseases but caution should be observed if a patient has severely sun-damaged skin or has a high-risk sun behaviour.

Small Angle X-Ray Scattering Detector

Energy Technology Data Exchange (ETDEWEB)

Hessler, Jan P.

2004-06-15

A detector for time-resolved small-angle x-ray scattering includes a nearly constant diameter, evacuated linear tube having an end plate detector with a first fluorescent screen and concentric rings of first fiber optic bundles for low angle scattering detection and an annular detector having a second fluorescent screen and second fiber optic bundles concentrically disposed about the tube for higher angle scattering detection. With the scattering source, i.e., the specimen under investigation, located outside of the evacuated tube on the tube's longitudinal axis, scattered x-rays are detected by the fiber optic bundles, to each of which is coupled a respective photodetector, to provide a measurement resolution, i.e., dq/q, where q is the momentum transferred from an incident x-ray to an x-ray scattering specimen, of 2% over two (2) orders of magnitude in reciprocal space, i.e., qmax/qmin approx=lO0.

Soft X-ray scanning transmission X-ray microscopy (STXM) of actinide particles.

Science.gov (United States)

Nilsson, Hans J; Tyliszczak, Tolek; Wilson, Richard E; Werme, Lars; Shuh, David K

2005-09-01

A descriptive account is given of our most recent research on the actinide dioxides with the Advanced Light Source Molecular Environmental Science (ALS-MES) Beamline 11.0.2 soft X-ray scanning transmission X-ray microscope (STXM) at the Lawrence Berkeley National Laboratory (LBNL). The ALS-MES STXM permits near-edge X-ray absorption fine structure (NEXAFS) and imaging with 30-nm spatial resolution. The first STXM spectromicroscopy NEXAFS spectra at the actinide 4d5/2 edges of the imaged transuranic particles, NpO2 and PuO2, have been obtained. Radiation damage induced by the STXM was observed in the investigation of a mixed oxidation state particle (Np(V,VI)) and was minimized during collection of the actual spectra at the 4d5/2 edge of the Np(V,VI) solid. A plutonium elemental map was obtained from an irregular PuO2 particle with the dimensions of 650 x 650 nm. The Pu 4d5/2 NEXAFS spectra were collected at several different locations from the PuO2 particle and were identical. A representative oxygen K-edge spectrum from UO2 was collected and resembles the oxygen K-edge from the bulk material. The unique and current performance of the ALS-MES STXM at extremely low energies (ca. 100 eV) that may permit the successful measurement of the actinide 5d edge is documented. Finally, the potential of STXM as a tool for actinide investigations is briefly discussed.

A flow cell for transient voltammetry and in situ grazing incidence X-ray diffraction characterization of electrocrystallized cadmium(II) tetracyanoquinodimethane

Energy Technology Data Exchange (ETDEWEB)

Veder, Jean-Pierre [Nanochemistry Research Institute, Department of Chemistry, Curtin University, GPO Box U1987, Perth, Western Australia 6845 (Australia); Nafady, Ayman [School of Chemistry, Monash University, Clayton, Victoria 3800 (Australia); Clarke, Graeme [Nanochemistry Research Institute, Department of Chemistry, Curtin University, GPO Box U1987, Perth, Western Australia 6845 (Australia); Williams, Ross P. [Centre for Materials Research, Department of Imaging and Applied Physics, Curtin University, GPO Box U1987, Perth, Western Australia 6845 (Australia); De Marco, Roland, E-mail: r.demarco@curtin.edu.a [Nanochemistry Research Institute, Department of Chemistry, Curtin University, GPO Box U1987, Perth, Western Australia 6845 (Australia); Bond, Alan M. [School of Chemistry, Monash University, Clayton, Victoria 3800 (Australia)

2011-01-01

An easy to fabricate and versatile cell that can be used with a variety of electrochemical techniques, also meeting the stringent requirement for undertaking cyclic voltammetry under transient conditions in in situ electrocrystallization studies and total external reflection X-ray analysis, has been developed. Application is demonstrated through an in situ synchrotron radiation-grazing incidence X-ray diffraction (SR-GIXRD) characterization of electrocrystallized cadmium (II)-tetracyanoquinodimethane material, Cd(TCNQ){sub 2}, from acetonitrile (0.1 mol dm{sup -3} [NBu{sub 4}][PF{sub 6}]). Importantly, this versatile cell design makes SR-GIXRD suitable for almost any combination of total external reflection X-ray analysis (e.g., GIXRF and GIXRD) and electrochemical perturbation, also allowing its application in acidic, basic, aqueous, non-aqueous, low and high flow pressure conditions. Nevertheless, the cell design separates the functions of transient voltammetry and SR-GIXRD measurements, viz., voltammetry is performed at high flow rates with a substantially distended window to minimize the IR (Ohmic) drop of the electrolyte, while SR-GIXRD is undertaken using stop-flow conditions with a very thin layer of electrolyte to minimize X-ray absorption and scattering by the solution.

X-ray spectrometry with synchrotron radiation; Roentgenspektrometrie mit Synchrotronstrahlung

Energy Technology Data Exchange (ETDEWEB)

Mueller, Matthias [Physikalisch-Technische Bundesanstalt (PTB), Berlin (Germany). Arbeitsgruppe ' Roentgen- und IR-Spektrometrie' ; Gerlach, Martin; Holfelder, Ina; Hoenicke, Philipp; Lubeck, Janin; Nutsch, Andreas; Pollakowski, Beatrix; Streeck, Cornelia; Unterumsberger, Rainer; Weser, Jan; Beckhoff, Burkhard

2014-12-15

The X-ray spectrometry of the PTB at the BESSY II storage ring with radiation in the range from 78 eV to 10.5 keV is described. After a description of the instrumentation development reference-sample free X-ray fluorescence analysis, the determination of fundamental atomic parameters, X-ray fluorescence analysis under glance-angle incidence, highly-resolving absorption spectrometry, and emission spectrometry are considered. Finally liquid cells and in-situ measurement techniques are described. (HSI)

Studies of amyotrophic lateral sclerosis by neutron activation analysis and x-ray microanalysis

International Nuclear Information System (INIS)

Iwata, Shiro; Sasajima, Kazuhisa; Yase, Yoshio; Uebayashi, Yushiro; Yoshida, Sohei.

1976-01-01

As a mean to elucidate the cause of ALS, the neutron activation method was employed in the analysis of metals contained in environmental samples obtained from areas of high incidence of the disease and in CNS tissue samples of the ALS cases. The X-ray microanalytical method was used to detect the distribution of certain elements including Ca, Al and Mn in spinal cord tissue samples of ALS and control autopsied cases. The results of these studies indicated a possible participation of these metal elements in the microscopic calcification occuring in the degenerated areas of the CNS, and this calcifying mechanism was discussed. (auth.)

Contained scanning electron microscope facility for examining radioactive materials

International Nuclear Information System (INIS)

Hsu, C.W.

1986-03-01

At the Savannah River Laboratory (SRL) radioactive solids are characterized with a scanning electron microscope (SEM) contained in a glove box. The system includes a research-grade Cambridge S-250 SEM, a Tracor Northern TN-5500 x-ray and image analyzer, and a Microspec wavelength-dispersive x-ray analyzer. The containment facility has a glove box train for mounting and coating samples, and for housing the SEM column, x-ray detectors, and vacuum pumps. The control consoles of the instruments are located outside the glove boxes. This facility has been actively used since October 1983 for high alpha-activity materials such as plutonium metal and plutonium oxide powders. Radioactive defense waste glasses and contaminated equipment have also been examined. During this period the facility had no safety-related incidents, and personnel radiation exposures were maintained at less than 100 mrems

X-ray dense cellular inclusions in the cells of the green alga Chlamydomonas reinhardtii as seen by soft-x-ray microscopy

International Nuclear Information System (INIS)

Stead, A.D.; Ford, T.W.; Page, A.M.; Brown, J.T.; Meyer-Ilse, W.

1997-01-01

Soft x-rays, having a greater ability to penetrate biological material than electrons, have the potential for producing images of intact, living cells. In addition, by using the so-called open-quotes water windowclose quotes area of the soft x-ray spectrum, a degree of natural contrast is introduced into the image due to differential absorption of the wavelengths by compounds with a high carbon content compared to those with a greater oxygen content. The variation in carbon concentration throughout a cell therefore generates an image which is dependent upon the carbon density within the specimen. Using soft x-ray contact microscopy the authors have previously examined the green alga Chlamydomonas reinhardtii, and the most prominent feature of the cells are the numerous x-ray absorbing spheres, But they were not seen by conventional transmission electron microscopy. Similar structures have also been reported by the Goettingen group using their cryo transmission x-ray microscope at BESSY. Despite the fact that these spheres appear to occupy up to 20% or more of the cell volume when seen by x-ray microscopy, they are not visible by transmission electron microscopy. Given the difficulties and criticisms associated with soft x-ray contact microscopy, the present study was aimed at confirming the existence of these cellular inclusions and learning more of their possible chemical composition

X-ray dense cellular inclusions in the cells of the green alga Chlamydomonas reinhardtii as seen by soft-x-ray microscopy

Energy Technology Data Exchange (ETDEWEB)

Stead, A.D.; Ford, T.W.; Page, A.M. [Univ. of London (United Kingdom); Brown, J.T.; Meyer-Ilse, W. [Ernest Orlando Lawrence Berkeley National Lab., CA (United States)

1997-04-01

Soft x-rays, having a greater ability to penetrate biological material than electrons, have the potential for producing images of intact, living cells. In addition, by using the so-called {open_quotes}water window{close_quotes} area of the soft x-ray spectrum, a degree of natural contrast is introduced into the image due to differential absorption of the wavelengths by compounds with a high carbon content compared to those with a greater oxygen content. The variation in carbon concentration throughout a cell therefore generates an image which is dependent upon the carbon density within the specimen. Using soft x-ray contact microscopy the authors have previously examined the green alga Chlamydomonas reinhardtii, and the most prominent feature of the cells are the numerous x-ray absorbing spheres, But they were not seen by conventional transmission electron microscopy. Similar structures have also been reported by the Goettingen group using their cryo transmission x-ray microscope at BESSY. Despite the fact that these spheres appear to occupy up to 20% or more of the cell volume when seen by x-ray microscopy, they are not visible by transmission electron microscopy. Given the difficulties and criticisms associated with soft x-ray contact microscopy, the present study was aimed at confirming the existence of these cellular inclusions and learning more of their possible chemical composition.

Dose-incidence relationships for exencephalia, anophthalmia and prenatal mortality in mouse embryos irradiated with fission neutrons or 250 kV X-rays

Energy Technology Data Exchange (ETDEWEB)

Friedberg, W.; Faulkner, D.N.; Neas, B.R.; Hanneman, G.D.; Darden, E.B. Jr.; Deal, R.B. Jr.; Parker, D.E.

1987-08-01

Groups of pregnant mice were irradiated at selected times between 10.00 hours on gestation day 7 and 16.00 hours on day 8. Each group received 0.39 Gy of neutrons or 1.60 Gy of X-rays, or was sham irradiated. We identified a period of high susceptibility of the embryos to radiation-induced exencephalia, anophthalmia and prenatal mortality early in gestation day 8. Dose-incidence relationships in this period were investigated with 0.19-0.48 Gy of neutrons and with 0.40-2.00 Gy of X-rays.

Dose-incidence relationships for exencephalia, anophthalmia and prenatal mortality in mouse embryos irradiated with fission neutrons or 250 kV X-rays

International Nuclear Information System (INIS)

Friedberg, W.; Faulkner, D.N.; Neas, B.R.; Hanneman, G.D.; Deal, R.B. Jr.; Parker, D.E.

1987-01-01

Groups of pregnant mice were irradiated at selected times between 10.00 hours on gestation day 7 and 16.00 hours on day 8. Each group received 0.39 Gy of neutrons or 1.60 Gy of X-rays, or was sham irradiated. We identified a period of high susceptibility of the embryos to radiation-induced exencephalia, anophthalmia and prenatal mortality early in gestation day 8. Dose-incidence relationships in this period were investigated with 0.19-0.48 Gy of neutrons and with 0.40-2.00 Gy of X-rays. (author)

Hard X-ray Optics Technology Development for Astronomy at the Marshall Space Flight Center

Science.gov (United States)

Gubarev, Mikhail; Ramsey, Brian; Kilaru, Kiranmayee

2009-01-01

Grazing-incidence telescopes based on Wolter 1 geometry have delivered impressive advances in astrophysics at soft-x-ray wavelengths, while the hard xray region remains relatively unexplored at fine angular resolution and high sensitivities. The ability to perform ground-breaking science in the hard-x-ray energy range had been the motivation for technology developments aimed at fabricating low-cost, light-weight, high-quality x-ray mirrors. Grazing-incidence x-ray optics for high-energy astrophysical applications is being developed at MSFC using the electroform-nickel replication process.

Picosecond chronography at x-ray wavelengths

International Nuclear Information System (INIS)

Bird, P.R.; Bradley, D.J.; Roddie, A.G.; Sibbett, W.; Key, M.H.; Lamb, M.J.; Lewis, C.L.S.

1975-01-01

An ultrafast streak camera for vacuum U-V to X-ray radiation is described. Preliminary measurements on laser-produced plasmas are presented with time resolution down to 150 psecs and space resolution down to 40μm for 1keV X-ray emission from a plasma generated by 2GW laser pulses focussed on a Cu target. High sensitivity and wide spectral bandwidth is due to front surface photoemission at oblique incidence. Time resolution capability of 40 psec and simultaneous spatial resolution down to a few microns is theoretically possible with this system. (author)

The National Ignition Facility modular Kirkpatrick-Baez microscope

Energy Technology Data Exchange (ETDEWEB)

Pickworth, L. A., E-mail: pickworth1@llnl.gov; Ayers, J.; Bell, P.; Brejnholt, N. F.; Buscho, J. G.; Bradley, D.; Decker, T.; Hau-Riege, S.; McCarville, T.; Pardini, T.; Vogel, J.; Walton, C. [Lawrence Livermore National Laboratory, Livermore, California 94550 (United States); Kilkenny, J. [General Atomics, San Diego, California 92121 (United States)

2016-11-15

Current two-dimensional X-ray imaging at the National Ignition Facility (NIF) uses time resolved pinhole cameras with ∼10-25 μm pinholes. This method has limitations in the smallest resolvable features that can be imaged with reasonable photon statistics for inertial confinement fusion (ICF) applications. ICF sources have a broadband self-emission spectrum that causes the pinhole images obtained, through thin foil filters, to contain a similarly broadband spectrum complicating the interpretation of structure in the source. In order to study phenomena on the scale of ∼5 μm, such as dopant mix in the ICF capsule, a narrow energy band, higher spatial resolution microscope system with improved signal/noise has been developed using X-ray optics. Utilizing grazing incidence mirrors in a Kirkpatrick-Baez microscope (KBM) configuration [P. Kirkpatrick and A. V. Baez, J. Opt. Soc. Am. 38, 766–774 (1948)], an X-ray microscope has been designed and fielded on NIF with four imaging channels. The KBM has ∼12 × magnification, <8 μm resolution, and higher throughput in comparison to similar pinhole systems. The first KBM mirrors are coated with a multilayer mirror to allow a “narrow band” energy response at 10.2 keV with ΔE ∼ 3 keV. By adjusting the mirror coating only, the energy response can be matched to the future experimental requirements. Several mirror packs have been commissioned and are interchangeable in the diagnostic snout.

LabVIEW control software for scanning micro-beam X-ray fluorescence spectrometer.

Science.gov (United States)

Wrobel, Pawel; Czyzycki, Mateusz; Furman, Leszek; Kolasinski, Krzysztof; Lankosz, Marek; Mrenca, Alina; Samek, Lucyna; Wegrzynek, Dariusz

2012-05-15

Confocal micro-beam X-ray fluorescence microscope was constructed. The system was assembled from commercially available components - a low power X-ray tube source, polycapillary X-ray optics and silicon drift detector - controlled by an in-house developed LabVIEW software. A video camera coupled to optical microscope was utilized to display the area excited by X-ray beam. The camera image calibration and scan area definition software were also based entirely on LabVIEW code. Presently, the main area of application of the newly constructed spectrometer is 2-dimensional mapping of element distribution in environmental, biological and geological samples with micrometer spatial resolution. The hardware and the developed software can already handle volumetric 3-D confocal scans. In this work, a front panel graphical user interface as well as communication protocols between hardware components were described. Two applications of the spectrometer, to homogeneity testing of titanium layers and to imaging of various types of grains in air particulate matter collected on membrane filters, were presented. Copyright © 2012 Elsevier B.V. All rights reserved.

X-Ray Polarimetry with GEMS

Science.gov (United States)

Strohmayer, Tod

2011-01-01

The polarization properties of cosmic X-ray sources are still largely unexplored. The Gravity and Extreme Magnetism SMEX (GEMS) will carry out the first sensitive X-ray polarization survey of a wide range of sources including; accreting compact objects (black holes and neutron stars), AGN, supernova remnants, magnetars and rotation-powered pulsars. GEMS employs grazing-incidence foil mirrors and novel time-projection chamber (TPC) polarimeters leveraging the photoelectric effect to achieve high polarization sensitivity in the 2 - 10 keV band. I will provide an update of the project status, illustrate the expected performance with several science examples, and provide a brief overview of the data analysis challenges

M-shell X-ray production cross-sections for elements with 67 ≤ Z ≤ 92 at incident photon energies EM1inc≤150keV

International Nuclear Information System (INIS)

Chauhan, Yogeshwar; Kumar, Anil; Puri, Sanjiv

2009-01-01

The X-ray production cross-sections for the Mk (k = ξ, δ, α, β, ζ, γ, m 1 and m 2 ) groups of X-rays have been evaluated for all the elements with 67 ≤ Z ≤ 92 at incident photon energies ranging E M 1 inc ≤150 keV using currently available theoretical data sets of different physical parameters, namely, partial photoionization cross-sections, X-ray emission rates, fluorescence and Coster-Kronig yields, and the K-shell/L j (j = 1-3) subshell to the M i (i = 1-5) subshell vacancy transfer probabilities, based on the independent particle models.

X-ray photographs of a solar active region with a multilayer telescope at normal incidence

Science.gov (United States)

Underwood, J. H.; Bruner, M. E.; Haisch, B. M.; Brown, W. A.; Acton, L. W.

1987-01-01

An astronomical photograph was obtained with a multilayer X-ray telescope. A 4-cm tungsten-carbon multilayer mirror was flown as part of an experimental solar rocket payload, and successful images were taken of the sun at normal incidence at a wavelength of 44 A. Coronal Si XII emission from an active region was recorded on film; as expected, the structure is very similar to that observed at O VIII wavelengths by the Solar Maximum Mission flat-crystal spectrometer at the same time. The small, simple optical system used in this experiment appears to have achieved a resolution of 5 to 10 arcsec.

X-ray fluorescence imaging with polycapillary X-ray optics

International Nuclear Information System (INIS)

Yonehara, Tasuku; Yamaguchi, Makoto; Tsuji, Kouichi

2010-01-01

X-ray fluorescence spectrometry imaging is a powerful tool to provide information about the chemical composition and elemental distribution of a specimen. X-ray fluorescence spectrometry images were conventionally obtained by using a μ-X-ray fluorescence spectrometry spectrometer, which requires scanning a sample. Faster X-ray fluorescence spectrometry imaging would be achieved by eliminating the process of sample scanning. Thus, we developed an X-ray fluorescence spectrometry imaging instrument without sample scanning by using polycapillary X-ray optics, which had energy filter characteristics caused by the energy dependence of the total reflection phenomenon. In the present paper, we show that two independent straight polycapillary X-ray optics could be used as an energy filter of X-rays for X-ray fluorescence. Only low energy X-rays were detected when the angle between the two optical axes was increased slightly. Energy-selective X-ray fluorescence spectrometry images with projection mode were taken by using an X-ray CCD camera equipped with two polycapillary optics. It was shown that Fe Kα (6.40 keV) and Cu Kα (8.04 keV) could be discriminated for Fe and Cu foils.

Preoperative chest x-ray findings in peptic ulcer perforation

Energy Technology Data Exchange (ETDEWEB)

Kim, T. H.; Kim, S. W.; Lim, J. S.; Kim, Y. J. [Kyungpook National University School of Medicine, Taegu (Korea, Republic of)

1981-12-15

This study was carried out to analyze the distribution of age, sex, chief complaint, physical examination and findings of chest x-ray films before operation in 59 cases of peptic ulcer perforation. The ratio of male to female was 1.7 : 1 and incidence of the ulcer perforation was most common in 5th decades. Thirty five among 59 cases showed pleural effusion, segmental atelectasis and pneumonic infiltration on chest x-ray film. Twenty nine among 50 cases of duodenal ulcer perforation and 6 of 9 cases of stomach ulcer perforation showed positive chest x-ray findings. No relationship was found between fever and preoperative chest x-ray findings.

Preoperative chest x-ray findings in peptic ulcer perforation

International Nuclear Information System (INIS)

Kim, T. H.; Kim, S. W.; Lim, J. S.; Kim, Y. J.

1981-01-01

This study was carried out to analyze the distribution of age, sex, chief complaint, physical examination and findings of chest x-ray films before operation in 59 cases of peptic ulcer perforation. The ratio of male to female was 1.7 : 1 and incidence of the ulcer perforation was most common in 5th decades. Thirty five among 59 cases showed pleural effusion, segmental atelectasis and pneumonic infiltration on chest x-ray film. Twenty nine among 50 cases of duodenal ulcer perforation and 6 of 9 cases of stomach ulcer perforation showed positive chest x-ray findings. No relationship was found between fever and preoperative chest x-ray findings

LabVIEW interface with Tango control system for a multi-technique X-ray spectrometry IAEA beamline end-station at Elettra Sincrotrone Trieste

Energy Technology Data Exchange (ETDEWEB)

Wrobel, P.M. [Physics Section, Nuclear Science and Instrumentation Laboratory (NSIL), IAEA Laboratories, A-2444 Seibersdorf (Austria); AGH University of Science and Technology, Faculty of Physics and Applied Computer Science, al. A. Mickiewicza 30, 30-059 Krakow (Poland); Bogovac, M. [Physics Section, Nuclear Science and Instrumentation Laboratory (NSIL), IAEA Laboratories, A-2444 Seibersdorf (Austria); Sghaier, H. [Physics Section, Nuclear Science and Instrumentation Laboratory (NSIL), IAEA Laboratories, A-2444 Seibersdorf (Austria); Institut Superieur d’Informatique et de Mathematiques de Monastir (ISIMM), Departement de technologie, 5000 Monastir (Tunisia); Leani, J.J. [Physics Section, Nuclear Science and Instrumentation Laboratory (NSIL), IAEA Laboratories, A-2444 Seibersdorf (Austria); IFEG – CONICET, Facultad de Matematica Astronomia y Fisica, Universidad Nacional de Cordoba, 5000 Cordoba (Argentina); Migliori, A.; Padilla-Alvarez, R. [Physics Section, Nuclear Science and Instrumentation Laboratory (NSIL), IAEA Laboratories, A-2444 Seibersdorf (Austria); Czyzycki, M. [Physics Section, Nuclear Science and Instrumentation Laboratory (NSIL), IAEA Laboratories, A-2444 Seibersdorf (Austria); AGH University of Science and Technology, Faculty of Physics and Applied Computer Science, al. A. Mickiewicza 30, 30-059 Krakow (Poland); Osan, J. [Physics Section, Nuclear Science and Instrumentation Laboratory (NSIL), IAEA Laboratories, A-2444 Seibersdorf (Austria); Environmental Physics Department, Hungarian Academy of Sciences Centre for Energy Research, Konkoly-Thege M. út 29-33., H-1121 Budapest (Hungary); Kaiser, R.B. [Physics Section, Nuclear Science and Instrumentation Laboratory (NSIL), IAEA Laboratories, A-2444 Seibersdorf (Austria); and others

2016-10-11

A new synchrotron beamline end-station for multipurpose X-ray spectrometry applications has been recently commissioned and it is currently accessible by end-users at the XRF beamline of Elettra Sincrotrone Trieste. The end-station consists of an ultra-high vacuum chamber that includes as main instrument a seven-axis motorized manipulator for sample and detectors positioning, different kinds of X-ray detectors and optical cameras. The beamline end-station allows performing measurements in different X-ray spectrometry techniques such as Microscopic X-Ray Fluorescence analysis (µXRF), Total Reflection X-Ray Fluorescence analysis (TXRF), Grazing Incidence/Exit X-Ray Fluorescence analysis (GI-XRF/GE-XRF), X-Ray Reflectometry (XRR), and X-Ray Absorption Spectroscopy (XAS). A LabVIEW Graphical User Interface (GUI) bound with Tango control system consisted of many custom made software modules is utilized as a user-friendly tool for control of the entire end-station hardware components. The present work describes this advanced Tango and LabVIEW software platform that utilizes in an optimal synergistic manner the merits and functionality of these well-established programming and equipment control tools. - Highlights: • A new methodology for control of a synchrotron beamline end-station is shown. • The new control system comprises a novel binding of Tango control system with LabVIEW interface. • The reliability of the control system is demonstrated by examples of analytical applications.

Electromigration in integrated circuit interconnects studied by X-ray microscopy

Energy Technology Data Exchange (ETDEWEB)

Schneider, G. E-mail: gschnei1@gwdg.de; Denbeaux, G.; Anderson, E.; Bates, W.; Salmassi, F.; Nachimuthu, P.; Pearson, A.; Richardson, D.; Hambach, D.; Hoffmann, N.; Hasse, W.; Hoffmann, K

2003-01-01

To study mass transport phenomena in advanced microelectronic devices with X-rays requires penetration of dielectric and Si layers up to 30 {mu}m thick. X-ray imaging at 1.8 keV photon energy provides a high amplitude contrast between Cu or Al interconnects and dielectric layers and can penetrate through the required thickness. To perform X-ray microscopy at 1.8 keV, a new Ru/Si multilayer was designed for the transmission X-ray microscope XM-1 installed at the Advanced Light Source in Berkeley. The mass flow in a passivated Cu interconnect was studied at current densities up to 10{sup 7} A/cm{sup 2}. In addition, we demonstrated the high material contrast from different elements in integrated circuits with a resolution of about 40 nm.

Electromigration in integrated circuit interconnects studied by X-ray microscopy

CERN Document Server

Schneider, G; Anderson, E; Bates, W; Salmassi, F; Nachimuthu, P; Pearson, A; Richardson, D; Hambach, D; Hoffmann, N; Hasse, W; Hoffmann, K

2003-01-01

To study mass transport phenomena in advanced microelectronic devices with X-rays requires penetration of dielectric and Si layers up to 30 mu m thick. X-ray imaging at 1.8 keV photon energy provides a high amplitude contrast between Cu or Al interconnects and dielectric layers and can penetrate through the required thickness. To perform X-ray microscopy at 1.8 keV, a new Ru/Si multilayer was designed for the transmission X-ray microscope XM-1 installed at the Advanced Light Source in Berkeley. The mass flow in a passivated Cu interconnect was studied at current densities up to 10 sup 7 A/cm sup 2. In addition, we demonstrated the high material contrast from different elements in integrated circuits with a resolution of about 40 nm.

X-ray microscopy study of track membranes and biological objects

International Nuclear Information System (INIS)

Artioukov, I.A.; Levashov, V.E.; Struk, I.I.; Vinogradov, A.V.; Asadchikov, V.E.; Mchedlishvili, B.V.; Postnov, A.A.; Vilensky, A.I.; Zagorsky, D.L.; Gulimova, V.I.; Saveliev, S.V.; Kurohtin, A.N.; Popov, A.V.

2000-01-01

The development of two types of X-ray microscopy applying to the organic objects investigation (biological samples and polymer matrix) is reported. Polymer track membranes were investigated using Schwarzchild X-ray microscope with 20 nm wavelength. Pore diameters down to 0.2 μm were clearly imaged. Contact X-ray microscopy at 0.229 nm wavelength was used to obtain clear images of inner structure of native biological samples. High contrast together with the high resolution (about 2-3 μm) allowed us to use this method for quantitative analysis of demineralization process taking place in the skeleton of amphibious after several weeks of weightlessness on biosputnik board

Design studies for ITER x-ray diagnostics

International Nuclear Information System (INIS)

Hill, K.W.; Bitter, M.; von Goeler, S.; Hsuan, H.

1995-01-01

Concepts for adapting conventional tokamak x-ray diagnostics to the harsh radiation environment of ITER include use of grazing-incidence (GI) x-ray mirrors or man-made Bragg multilayer (ML) elements to remove the x-ray beam from the neutron beam, or use of bundles of glass-capillary x-ray ''light pipes'' embedded in radiation shields to reduce the neutron/gamma-ray fluxes onto the detectors while maintaining usable x-ray throughput. The x-ray optical element with the broadest bandwidth and highest throughput, the GI mirror, can provide adequate lateral deflection (10 cm for a deflected-path length of 8 m) at x-ray energies up to 12, 22, or 30 keV for one, two, or three deflections, respectively. This element can be used with the broad band, high intensity x-ray imaging system (XIS), the pulseheight analysis (PHA) survey spectrometer, or the high resolution Johann x-ray crystal spectrometer (XCS), which is used for ion-temperature measurement. The ML mirrors can isolate the detector from the neutron beam with a single deflection for energies up to 50 keV, but have much narrower bandwidth and lower x-ray power throughput than do the GI mirrors; they are unsuitable for use with the XIS or PHA, but they could be used with the XCS; in particular, these deflectors could be used between ITER and the biological shield to avoid direct plasma neutron streaming through the biological shield. Graded-d ML mirrors have good reflectivity from 20 to 70 keV, but still at grazing angles (<3 mrad). The efficiency at 70 keV for double reflection (10 percent), as required for adequate separation of the x-ray and neutron beams, is high enough for PHA requirements, but not for the XIS. Further optimization may be possible

ORNL 10-m small-angle X-ray scattering camera

International Nuclear Information System (INIS)

Hendricks, R.W.

1979-12-01

A new small-angle x-ray scattering camera utilizing a rotating anode x-ray source, crystal monochromatization of the incident beam, pinhole collimation, and a two-dimensional position-sensitive proportional counter was developed. The sample, and the resolution element of the detector are each approximately 1 x 1 mm 2 , the camera was designed so that the focal spot-to-sample and sample-to-detector distances may each be varied in 0.5-m increments up to 5 m to provide a system resolution in the range 0.5 to 4.0 mrad. A large, general-purpose specimen chamber has been provided into which a wide variety of special-purpose specimen holders can be mounted. The detector has an active area of 200 x 200 mm and has up to 200 x 200 resolution elements. The data are recorded in the memory of a minicomputer by a high-speed interface which uses a microprocessor to map the position of an incident photon into an absolute minicomputer memory address. The data recorded in the computer memory can be processed on-line by a variety of programs designed to enhance the user's interaction with the experiment. At the highest angular resolution (0.4 mrad), the flux incident on the specimen is 1.0 x 10 6 photons/s with the x-ray source operating at 45 kV and 100 mA. SAX and its associated programs OVF and MOT are high-priority, pre-queued, nonresident foreground tasks which run under the ModComp II MAX III operating system to provide complete user control of the ORNL 10-m small-angle x-ray scattering camera

X-ray tomography: Biological cells in 3-D at better than 50 nm resolution

International Nuclear Information System (INIS)

Larabell, C.; Le Gros, M.

2004-01-01

Full text: X-ray microscopy can be used to image whole, hydrated, specimens with a spatial resolution 5-10 times better than that obtained using visible light microscopy. X-ray imaging at photon energies below the K- absorption edge of oxygen, referred to as the water window, exploits the strong natural contrast for organic material embedded in a mostly water matrix. With a transmission X-ray microscope using Fresnel zone plate optics, specimens up to 10 microns thick can be examined. The highest X-ray transmission in hydrated samples is obtained at a wavelength of 2.4 nm but, due to the low numerical aperture of zone plate lenses operated in st order diffraction mode the structures resolved are much larger than the X-ray wavelength. Because of the low NA of X-ray lenses (NA=0.05), combined with the effect of polychromatic illumination and a wavelength dependant focal length, the effective depth of ld is large (6-10 microns). The experiments presented here were performed at the Advanced Light Source using the full ld transmission X-ray microscope, XM-1. This microscope employs a bend magnet X-ray source and zone plate condenser and objective lenses. The condenser zone plate acts as a monochromator and the X-ray images are recorded directly on a cooled, back-thinned 1024x1024 pixel CCD camera. The sample holder was a rotationally symmetric glass tube; the region containing the sample was 10 microns in diameter with a wall thickness of 200 nm. Live yeast cells were loaded into the tube, rapidly frozen by a blast of liquid nitrogen-cooled helium gas, and maintained at 140 deg C by a steady flow of cold helium. The image sequence spanned 180 deg and consisted of 45 images spaced by 4 deg. The images were aligned to a common axis and computed tomographic reconstruction was used to obtain the 3-D X-ray linear absorption coefficient. Volume rendering and animation of reconstructed data was performed using the 3-D program, Amira. Acquisition time for 90 images was 3 min

Hard X-ray Microscopy with Elemental, Chemical and Structural Contrast

International Nuclear Information System (INIS)

Schroer, C.G.; Boye, P.; Feldkamp, J.P.

2010-01-01

We review hard X-ray microscopy techniques with a focus on scanning microscopy with synchrotron radiation. Its strength compared to other microscopies is the large penetration depth of hard x rays in matter that allows one to investigate the interior of an object without destructive sample preparation. In combination with tomography, local information from inside of a specimen can be obtained, even from inside special non-ambient sample environments. Different X-ray analytical techniques can be used to produce contrast, such as X-ray absorption, fluorescence, and diffraction, to yield chemical, elemental, and structural information about the sample, respectively. This makes X-ray microscopy attractive to many fields of science, ranging from physics and chemistry to materials, geo-, and environmental science, biomedicine, and nanotechnology. Our scanning microscope based on nanofocusing refractive X-ray lenses has a routine spatial resolution of about 100 nm and supports the contrast mechanisms mentioned above. In combination with coherent X-ray diffraction imaging, the spatial resolution can be improved to the 10 nm range. The current state-of-the-art of this technique is illustrated by several examples, and future prospects of the technique are given. (author)

Synchrotron X-ray fluorescence analysis in environmental and earth sciences

Directory of Open Access Journals (Sweden)

Adams F.

2010-12-01

Full Text Available Compared to other microscopic analytical tools X-ray microscopy techniques have the advantage that the large penetration depth of X-rays in matter allows one to investigate the interior of an object without destructive sample preparation. In combination with X-ray fluorescence tomography, analytical information from inside of a specimen can be obtained. Different X-ray analytical techniques can be used to produce contrast, X-ray absorption, fluorescence, and diffraction, to yield chemical, elemental, and structural information about the sample. Scanning microscopy on the basis of various lens systems in synchrotron radiation sources provides a routine spatial resolution of now about 100 nanometer but in the foreseeable future a 10–20 nanometer spatial resolution can be expected. X-ray absorption spectrometry can also provide chemical (speciation information on the sample. All this makes X-ray microscopy attractive to many fields of science. In this paper the techniques are briefly reviewed and a number of applications in the earth, planetary and cosmos sciences are illustrated with state-of-the art examples, while applications in the environmental sciences and biology are also briefly discussed.

Study on exposures in incidents situations involving X-ray generators of industrial use

International Nuclear Information System (INIS)

Rios, Paulo B.; Rios, Denise A. da S.

2014-01-01

Case studies of accidents involving radiation sources provides valuable information for the improvement of equipment and procedures to be adopted to prevent their recurrence. Therefore, they are recommended as part of the licensing process of radiative facilities. However, when the equipment has no radiological protection requirements or have no record of accidents, an effective method to appropriate this knowledge necessary to improvements of process and project is the investigation of reported incidents and the proposition limit situations where exposures unlikely and even low intensity can occur. This work reviews incidents in X-ray equipment and thickness meters. Emergency situations are also studied in this type of equipment and in an accelerator of electrons self-shielded for curing of paints and varnishes. The exposure estimates are calculated from data collected in workplaces on the distance and time for each proposed case. Although there is no severe consequences to occupational health, the results can be used to improve the quality of training for operators and maintenance technicians, for proposing of new alarm systems and emergency teams procedures and may serve as a warning in inadvertent and avoidable situations of unnecessary exposures

Depth distribution of chemical phase concentration determined by grazing incidence X-ray diffraction

International Nuclear Information System (INIS)

Novak, P.; Ballo, P.; Dobrocka, E.; Vallo, M.; Lalinsky, T.

2013-01-01

Grazing incidence geometry is widely used in X-ray diffraction analysis of thin films. Penetration depth of radiation can be easily changed by an appropriate selection of the angle of incidence α that enables obtaining information from different depths of the sample. This depth can be decreased up to a nanometer scale by approaching the critical angle α_c for total external reflection. This method therefore provides an efficient tool for the analysis of depth distribution of various structural properties, such as the crystallite size, the amorphous fraction, stress or the concentration of chemical phase. However, absorption of the radiation can be characterized by an average attenuation coefficient μ a special care has to be paid to the last property. Variation of chemical phase concentration with depth usually results in depth dependence on the attenuation coefficient. In this contribution a method for determination of depth distribution of a chemical phase is outlined. The method correctly takes into account the depth variation of the attenuation coefficient. The method is tested on thin oxidized Ir layers. The aim of this paper is a comparison two simple model cases with the experimental results. (authors)

Crystalline self-assembly of organic molecules with metal ions at the air-aqueous solution interface. A grazing incidence X-ray scattering study

DEFF Research Database (Denmark)

Weissbuch, I.; Buller, R.; Kjær, K.

2002-01-01

The advent of intense X-rays from synchrotron sources made possible to probe, at the molecular level, the structural aspects of self-assemblies generated at interfaces. Here we present the two-dimensional (2-D) packing arrangements of two-, three- and multi-component organo-metallic self......-assemblies formed via interfacial reaction at the air-aqueous solution interface, as determined by grazing incidence X-ray diffraction (GIRD) and X-ray specular reflectivity techniques. GIXD yields structural information on the crystalline part of the Langmuir film, including the ions and counterions lateral order...... of metal ions bound to the polar head groups of amphipilic molecules; use of bolaamphiphiles to generate oriented thin films with metal ions arranged in periodic layers; delineation of differences in the lateral organization of metal ions at interfaces as induced by racemates and enantiomerically pure...

Energy-dispersive X-ray microanalysis of elements' content and ...

African Journals Online (AJOL)

This study was designed to investigate elements' content and anti-microbial effects of two Malaysian plants, Pereskia bleo and Goniothalamus umbrosus. Elements' analysis was carried out using Energy Dispersive X-ray Microanalysis combined with Variable Pressure Scanning Electron Microscope (EDX, VPSEM).

Thin film characterisation by advanced X-ray diffraction techniques

International Nuclear Information System (INIS)

Cappuccio, G.; Terranova, M.L.

1996-09-01

The Fifth School on X-ray diffraction from polycrystalline materials was devoted to thin film characterization by advanced X-ray diffraction techniques. Twenty contributions are contained in this volume; all twenty are recorded in the INIS Database. X-ray diffraction is known to be a powerful analytical tool for characterizing materials and understanding their structural features. The aim of these articles is to illustrate the fundamental contribution of modern diffraction techniques (grazing incidence, surface analysis, standing waves, etc.) to the characterization of thin and ultra-thin films, which have become important in many advanced technologies

Study of secondary X-rays from radiographic intensifying screens

International Nuclear Information System (INIS)

Barroso, R.C.; Eichler, J.; Lopes, R.T.; Cardoso, S.C.

1998-01-01

To reduce the radiation dose in radiology, fluorescent intensifying screens for X-ray films are used. They produce visible light which increases the efficiency of the film. In addition, there are two other effects that will degrade the image resolution. First, the gadolinium present in the screens produces X-rays isotropically. Second, the primary radiation can be scattered elastically (Rayleigh scattering) and inelastically (Compton scattering). The intensity and angular distribution of these secondary radiation were measured, showing that the ratio of secondary-to-primary radiation incident on the X-ray film is about 16%. (orig.)

Multi-scale characteristics of coal structure by x-ray computed tomography (x-ray CT), scanning electron microscope (SEM) and mercury intrusion porosimetry (MIP)

Science.gov (United States)

Cai, Ting-ting; Feng, Zeng-chao; Zhou, Dong

2018-02-01

It is of great benefit to study the material and structural heterogeneity of coal for better understanding the coalbed methane (CBM) storage and enrichment. In this paper, multi-scale X-ray computed tomography (CT), scanning electron microscope (SEM) and mercury intrusion porosimetry (MIP) at multi scales were conducted to thoroughly study the material distribution, heterogeneity, pore development, porosity and permeability of coal. It is suitable and reasonable to divide the testing samples into three structural categories by average density and heterogeneity degree, and the meso structure in the three categories accords with the morphology on SEM images. The pore size distribution and pore development of each subsample cannot be correspondingly related to their respective structure category or morphology due to different observation scales, while the macro pore size development, accumulated macro pore volume and macro pores porosity accord with the meso structure category and morphology information by CT and SEM at the same scale very well. Given the effect of macro pores on permeability and the contribution of micro pores to CBM storage capacity, reservoirs with developed micro pores and macro pores may be the most suitable coal reservoir for CBM exploitation.

10th International Conference on X-Ray Lasers

CERN Document Server

Nickles, P.V; X-Ray Lasers 2006

2007-01-01

The search for table-top and repetitive pump schemes during the last decade has been the driving force behind the spectacular advances demonstrated during the 10th International Conference on X-Ray Lasers, organized in 2006 in Berlin. Since 1986, international experts have gathered every two years at this established conference to discuss the progress in theory, experiment and application of plasma-based soft X-ray lasers. Traditionally, the conference sessions devoted to complementary and alternative sources of short wavelength radiation, such as high harmonics, XFEL or incoherent X-rays are organized so as to emphasize the role of X-ray laser research in relation to the other short wavelength sources. Grazing incidence pumping (GRIP) and seeding with high harmonics were the dominant topics of the conference. High repetition rate and portable X-ray lasers were reported to have been applied in metrology and photochemistry for the first time. The proceedings of this series of conferences constitute a comprehen...

X-ray backscatter imaging with a spiral scanner

International Nuclear Information System (INIS)

Bossi, R.H.; Cline, J.L.; Friddell, K.D.

1989-01-01

X-ray backscatter imaging allows radiographic inspections to be performed with access to only one side of the object. A collimated beam of radiation striking an object will scatter x-rays by Compton scatter and x-ray fluorescence. A detector located on the source side of the part will measure the backscatter signal. By plotting signal strength as gray scale intensity vs. beam position on the object, an image of the object can be constructed. A novel approach to the motion of the collimated incident beam is a spiral scanner. The spiral scanner approach, described in this paper, can image an area of an object without the synchronized motion of the object or detector, required by other backscatter imaging techniques. X-ray backscatter is particularly useful for flaw detection in light element materials such as composites. The ease of operation and the ability to operate non-contact from one side of an object make x-ray backscatter imaging of increasing interest to industrial inspection problems

The epitaxial growth and interfacial strain study of VO{sub 2}/MgF{sub 2} (001) films by synchrotron based grazing incidence X-ray diffraction

Energy Technology Data Exchange (ETDEWEB)

Fan, L.L. [Key Laboratory for Advanced Technology in Environmental Protection of Jiangsu Province, Yancheng Institute of Technology, Yancheng 224051 (China); National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029 (China); Chen, S. [National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029 (China); Liu, Q.H. [Science and Technology on Electro-optical Information Security Control Laboratory, Tianjin 300300 (China); Liao, G.M.; Chen, Y.L.; Ren, H. [National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029 (China); Zou, C.W., E-mail: czou@ustc.edu.cn [National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029 (China)

2016-09-05

High quality VO{sub 2} films with different thickness were epitaxially grown on MgF{sub 2} (001) substrates by oxide molecular beam epitaxy method. The evolution of interfacial strain was investigated by synchrotron based grazing incidence X-ray diffraction. By adjusting the incidence angles, the penetration depth of X-ray in VO{sub 2} film could be controlled and the thickness-depend lattice distortion in the epitaxial VO{sub 2} film was investigated. Due to the lattice mismatching, the pronounced tensile strain was observed in ultra-thin VO{sub 2} film. As the film thickness increasing, the interfacial strain relaxed gradually and became fully relaxed for thick VO{sub 2} films. Combined with the electric transport measurement, it was revealed that the phase transition temperature of ultra-thin VO{sub 2} film decreased greatly. The effect of interfacial strain induced phase transition modulation and the intrinsic mechanism was systematically discussed. - Highlights: • We prepared high quality VO{sub 2} epitaxial films on MgF{sub 2} (001) substrates by oxide molecular beam epitaxy method. • Synchrotron radiation grazing incidence X-ray diffraction was employed to detect evolution of strain along depth profile. • Based on a classic band structure model, the mechanism of strain controlled phase transition of VO{sub 2} was discussed.

Effect of Ar9+ irradiation on Zr-1Nb-1Sn-0.1Fe alloy characterized by Grazing Incidence X-ray diffraction technique

Science.gov (United States)

Dutta, Argha; Das, Kalipada; Gayathri, N.; Menon, Ranjini; Nabhiraj, P. Y.; Mukherjee, Paramita

2018-03-01

The microstructural parameters such as domain size and microstrain have been estimated from Grazing Incidence X-ray Diffraction (GIXRD) data for Ar9+ irradiated Zr-1Nb-1Sn-0.1Fe sample as a function of dpa (dose). Detail studies using X-ray Diffraction Line Profile Analysis (XRDLPA) from GIXRD data has been carried out to characterize the microstructural parameters like domain size and microstrain. The reorientation of the grains due to effect of irradiation at high dpa (dose) has been qualitatively assessed by the texture parameter P(hkl).

Temporal resolution limit estimation of x-ray streak cameras using a CsI photocathode

Energy Technology Data Exchange (ETDEWEB)

Li, Xiang; Gu, Li; Zong, Fangke; Zhang, Jingjin; Yang, Qinlao, E-mail: qlyang@szu.edu.cn [Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, Institute of Optoelectronics, Shenzhen University, Shenzhen 518060 (China)

2015-08-28

A Monte Carlo model is developed and implemented to calculate the characteristics of x-ray induced secondary electron (SE) emission from a CsI photocathode used in an x-ray streak camera. Time distributions of emitted SEs are investigated with an incident x-ray energy range from 1 to 30 keV and a CsI thickness range from 100 to 1000 nm. Simulation results indicate that SE time distribution curves have little dependence on the incident x-ray energy and CsI thickness. The calculated time dispersion within the CsI photocathode is about 70 fs, which should be the temporal resolution limit of x-ray streak cameras that use CsI as the photocathode material.

Soft X-ray Focusing Telescope Aboard AstroSat: Design, Characteristics and Performance

DEFF Research Database (Denmark)

Singh, K; Stewart, G.; Westergaard, Niels Jørgen Stenfeldt

2017-01-01

The Soft X-ray focusing Telescope (SXT), India’s first X-ray telescope based on the principle of grazing incidence, was launched aboard the AstroSat and made operational on October 26, 2015. X-rays in the energy band of 0.3–8.0 keV are focussed on to a cooled charge coupled device thus providing ...

Grazing incidence x-ray diffraction at free-standing nanoscale islands: fine structure of diffuse scattering

International Nuclear Information System (INIS)

Grigoriev, D; Hanke, M; Schmidbauer, M; Schaefer, P; Konovalov, O; Koehler, R

2003-01-01

We have investigated the x-ray intensity distribution around 220 reciprocal lattice point in case of grazing incidence diffraction at SiGe nanoscale free-standing islands grown on Si(001) substrate by LPE. Experiments and computer simulations based on the distorted wave Born approximation utilizing the results of elasticity theory obtained by FEM modelling have been carried out. The data reveal fine structure in the distribution of scattered radiation with well-pronounced maxima and complicated fringe pattern. Explanation of the observed diffraction phenomena in their relation to structure and morphology of the island is given. An optimal island model including its shape, size and Ge spatial distribution was elaborated

Fine surface structure of unfixed and hydrated macrophages observed by laser-plasma x-ray contact microscopy

International Nuclear Information System (INIS)

Yamamoto, Yoshimasa; Friedman, Herman; Yoshimura, Hideyuki; Kinjo, Yasuhito; Shioda, Seiji; Debari, Kazuhiro; Shinohara, Kunio; Rajyaguru, Jayshree; Richardson, Martin

2000-01-01

A compact, high-resolution, laser-plasma, x-ray contact microscope using a table-top Nd:glass laser system has been developed and utilized for the analysis of the surface structure of live macrophages. Fine fluffy surface structures of murine peritoneal macrophages, which were live, hydrolyzed and not sliced and stained, were observed by the x-ray microscope followed by analysis using an atomic force microscopy. In order to compare with other techniques, a scanning electron microscopy (SEM) was utilized to observe the surface structure of the macrophages. The SEM offered a fine whole cell image of the same macrophages, which were fixed and dehydrated, but the surfaces were ruffled and different from that of x-ray images. A standard light microscope was also utilized to observe the shape of live whole macrophages. Light microscopy showed some fluffy surface structures of the macrophages, but the resolution was too low to observe the fine structures. Thus, the findings of fine fluffy surface structures of macrophages by x-ray microscopy provide valuable information for studies of phagocytosis, cell spreading and adherence, which are dependent on the surface structure of macrophages. Furthermore, the present study also demonstrates the usefulness of x-ray microscopy for analysis of structures of living cells

X-ray microanalysis with transition edge sensors. The future of material analysis with scanning electron microscopes

Energy Technology Data Exchange (ETDEWEB)

Hollerith, C.

2006-07-05

In current experiments and technical applications the demand for new and advanced concepts for the detection of radiation and particle is increasing. Low temperature detectors such as Transition Edge Sensors (TES) have been developed as ultrahigh-resolution radiation and particle detectors offering advantages in manifold applications. They were designed primarily for astrophysical experiments such as the dark matter search. In material analysis they have been introduced to revolutionize mass spectroscopy of biological molecules and Energy Dispersive X-ray Spectroscopy (EDS). EDS is the determination of the elemental constitution of samples in scanning electron microscopes (SEMs) with characteristic X-ray radiation excited by the electron beam. The use of TES detectors improves the EDS analysis of small volumes such as particles or thin layers. This is especially important for the semiconductor industry because of the continual shrinking of device size. Current structure sizes of 65 nm are already demanding new approaches in analytic methodology. In this thesis the introduction and improvement of a fully automated TES detector system in the industrial environment of a semiconductor failure analysis lab is described. This system, marketed under the trade name of 'Polaris' by the manufacturer, is based on a mechanical pulse tube cooler in combination with an adiabatic demagnetization refrigerator (ADR) for cooling the TES detector to its operating temperature. Several large improvements had to be made to the system during the total system integration. The energy resolution could be improved significantly thus enabling a better peak separation and the measurement of chemical shifts. Due to the small area of TES detectors compared with conventional EDS detectors the efficiency of the system proved to be too low for everyday use. A polycapillary X-ray lens was added to the system in order to solve this problem. The application of the lens, however, brought its

Soft x-ray scanning microtomography with submicron resolution

International Nuclear Information System (INIS)

McNulty, I.; Haddad, W.S.; Trebes, J.E.; Anderson, E.H.

1994-01-01

Scanning soft x-ray microtomography was used to obtain high-resolution three-dimensional images of a microfabricated test object. Using a special rotation stage mounted on the scanning transmission x-ray microscope at the XIA Beamline at the National Synchrotron Light Source, we recorded nine two-dimensional projections of the 3D test object over an angular range of -50 degrees to +55 degrees. The x-ray wavelength was 3.6 nm and the radiation dose to the object per projection was approximately 2 x 10 6 Gy. The object consisted of two gold patterns supported on transparent silicon nitride membranes, separated by 4.75 Jim, with 100 to 300-nm wide and 65-nm thick features. We reconstructed a volumetric data set of the test object from the two-dimensional projections using an algebraic reconstruction technique algorithm. Features of the test object were resolved to ∼100 nm in transverse and longitudinal extent in three-dimensional images rendered from the volumetric set

VPD residue search by monitoring scattered x-rays

International Nuclear Information System (INIS)

Mori, Y.; Yamagami, M.; Yamada, T.

2000-01-01

Recently, VPD-TXRF has come into wide use for semiconductor analysis. In VPD-TXRF technique, adjusting the mechanical measuring point to the center of dried residue is of importance for accurate determination. Until now, the following searching methods have been used: monitoring light scattering under bright illumination, using laser scattering particle mapper, applying internal standard as a marker. However, each method has individual disadvantage. For example, interference of Kβ line (ex. Sc-Kβ to Ti-Kα) occurs in the internal standard method. We propose a new searching method 'scattered x-ray search' which utilizes x-ray scattering form the dried residue as a marker. Since the line profile of x-ray scattering agrees with that of fluorescent x-rays, scattered x-ray can be used as an alternative marker instead of internal standard. According to our experimental results, this search method shows the same accuracy as internal standard method. The merits are as follows: 1) no need to add internal standard, 2) rapid search because of high intensity of scattered x-rays, 3) searching software for internal standard can be applied without any modification. In this method, diffraction of incident x-rays by substrate causes irregular change over the detected scattering x-rays. Therefore, this method works better under x-y controlled stage than r-Θ one. (author)

Studying atomic-resolution by X-ray fluorescence holography

International Nuclear Information System (INIS)

Gao Hongyi; Chen Jianwen; Xie Honglan; Zhu Huafeng; Li Ruxin; Xu Zhizhan

2005-01-01

In this work, the results of numerical simulations of X-ray fluorescence holograms and the reconstructed atomic images for Fe single crystal are given. The influences of the recording angles ranges and the polarization effect on the reconstruction of the atomic images are discussed. The process for removing twin images by multiple energy fluorescence holography and expanding the energy range of the incident X-rays to improve the resolution of the reconstructed images is presented

New optical scheme for differential measurements of diffraction reflection intensity on X-radiation sliding incidence

International Nuclear Information System (INIS)

Golovin, A.L.; Mas', E.T.

1989-01-01

An X-ray optical scheme for differential measurements of X-ray diffraction under sliding incidence conditions is proposed and an attachment design realizng this scheme, using standard equipment, is described. The main feature of the scheme is the following: collimation according to the Bragg angle is carried out for the reflected beam rather than the incident one. Goniometers can be used from DRON, TRS, GS-5 and other spectrometers. The goniometer head carrying the sample is standard, it is a part of the DRON, TRS and DTS. The crystal analyzer is fixed on the attachment. The angular position of the crystal monochromator is controlled by an inductive sensor. The experimental differential curves of X-ray diffraction under conditions of sliding incidence, taken for a silicon crystal having the 111 orientation, are given as well

Soft X-ray imaging by optically stimulated luminescence from color centers in lithium fluoride

Energy Technology Data Exchange (ETDEWEB)

Bonfigli, F. [ENEA, C.R. Frascati, Via E. Fermi, 45, 00044 Frascati (Rome) (Italy)], E-mail: bonfigli@frascati.enea.it; Almaviva, S.; Baldacchini, G.; Bollanti, S.; Flora, F.; Lai, A.; Montereali, R.M. [ENEA, C.R. Frascati, Via E. Fermi, 45, 00044 Frascati (Rome) (Italy); Nichelatti, E. [ENEA, C.R. Casaccia, Via Anguillarese 301, 00060 S.Maria di Galeria (Rome) (Italy); Tomassetti, G.; Ritucci, A.; Reale, L. [Universita de L' Aquila e INFN, Dip. di Fisica, Coppito, L' Aquila (Italy); Faenov, A. Ya.; Pikuz, T.A. [MISDC of VNIIFTRI Mendeleevo, Moscow region, 141570 (Russian Federation); Larciprete, R. [ISC-CNR, Sezione Montelibretti, Via Salaria, Km. 29.3, 00016 Monterotondo Scalo (Rome) (Italy); Gregoratti, L.; Kiskinova, M. [Sincrotrone Trieste, S. S. 14, Km. 163.5, 34012 Basovizza (TS) (Italy)

2007-07-15

An innovative X-ray imaging detector based on Optically Stimulated Luminescence from color centers in lithium fluoride is presented. Regular photoluminescent patterns produced on LiF samples by different intense X-ray sources, like synchrotrons, laser plasma sources and a capillary discharge laser have been investigated by a Confocal Laser Scanning Microscope. The use of a LiF-based imaging plate for X-ray microscopy is also discussed showing microradiographies of small animals.

Time-resolved X-ray transmission microscopy on magnetic microstructures; Zeitaufloesende Roentgentransmissionsmikroskopie an magnetischen Mikrostrukturen

Energy Technology Data Exchange (ETDEWEB)

Puzic, Aleksandar

2007-10-23

Three excitation schemes were designed for stroboscopic imaging of magnetization dynamics with time-resolved magnetic transmission X-ray microscopy (TR-MTXM). These techniques were implemented into two types of X-ray microscopes, namely the imaging transmission X-ray microscope (ITXM) and the scanning transmission X-ray microscope (STXM), both installed at the electron storage ring of the Advanced Light Source in Berkeley, USA. Circular diffraction gratings (Fresnel zone plates) used in both microscopes as focusing and imaging elements presently allow for lateral resolution down to 30 nm. Magnetic imaging is performed by using the X-ray magnetic circular dichroism (XMCD) as element specific contrast mechanism. The developed methods have been successfully applied to the experimental investigation of magnetization dynamics in ferromagnetic microstructures. A temporal resolution well below 100 ps was achieved. A conventional pump-probe technique was implemented first. The dynamic response of the magnetization excited by a broadband pulsed magnetic field was imaged spatially resolved using focused X-ray flashes. As a complementary method, the spatially resolved ferromagnetic resonance (SR-FMR) technique was developed for experimental study of magnetization dynamics in the frequency domain. As a third excitation mode, the burst excitation was implemented. The performance and efficiency of the developed methods have been demonstrated by imaging the local magnetization dynamics in laterally patterned ferromagnetic thin-film elements and three-layer stacks. The existence of multiple eigenmodes in the excitation spectra of ferromagnetic microstructures has been verified by using the pump-probe technique. Magnetostatic spin waves were selectively excited and detected with a time resolution of 50 ps using the SR-FMR technique. Thorough analysis of 20 in most cases independently prepared samples has verified that vortices which exhibit a low-amplitude switching of their core

Evolutionary developments in x ray and electron energy loss microanalysis instrumentation for the analytical electron microscope

Science.gov (United States)

Zaluzec, Nester J.

Developments in instrumentation for both X ray Dispersive and Electron Energy Loss Spectroscopy (XEDS/EELS) over the last ten years have given the experimentalist a greatly enhanced set of analytical tools for characterization. Microanalysts have waited for nearly two decades now in the hope of getting a true analytical microscope and the development of 300 to 400 kV instruments should have allowed us to attain this goal. Unfortunately, this has not generally been the case. While there have been some major improvements in the techniques, there has also been some devolution in the modern AEM (Analytical Electron Microscope). In XEDS, the majority of today's instruments are still plagued by the hole count effect, which was first described in detail over fifteen years ago. The magnitude of this problem can still reach the 20 percent level for medium atomic number species in a conventional off-the-shelf intermediate voltage AEM. This is an absurd situation and the manufacturers should be severely criticized. Part of the blame, however, also rests on the AEM community for not having come up with a universally agreed upon standard test procedure. Fortunately, such a test procedure is in the early stages of refinement. The proposed test specimen consists of an evaporated Cr film approx. 500 to 1000A thick supported upon a 3mm diameter Molybdenum 200 micron aperture.

A customizable software for fast reduction and analysis of large X-ray scattering data sets: applications of the new DPDAK package to small-angle X-ray scattering and grazing-incidence small-angle X-ray scattering.

Science.gov (United States)

Benecke, Gunthard; Wagermaier, Wolfgang; Li, Chenghao; Schwartzkopf, Matthias; Flucke, Gero; Hoerth, Rebecca; Zizak, Ivo; Burghammer, Manfred; Metwalli, Ezzeldin; Müller-Buschbaum, Peter; Trebbin, Martin; Förster, Stephan; Paris, Oskar; Roth, Stephan V; Fratzl, Peter

2014-10-01

X-ray scattering experiments at synchrotron sources are characterized by large and constantly increasing amounts of data. The great number of files generated during a synchrotron experiment is often a limiting factor in the analysis of the data, since appropriate software is rarely available to perform fast and tailored data processing. Furthermore, it is often necessary to perform online data reduction and analysis during the experiment in order to interactively optimize experimental design. This article presents an open-source software package developed to process large amounts of data from synchrotron scattering experiments. These data reduction processes involve calibration and correction of raw data, one- or two-dimensional integration, as well as fitting and further analysis of the data, including the extraction of certain parameters. The software, DPDAK (directly programmable data analysis kit), is based on a plug-in structure and allows individual extension in accordance with the requirements of the user. The article demonstrates the use of DPDAK for on- and offline analysis of scanning small-angle X-ray scattering (SAXS) data on biological samples and microfluidic systems, as well as for a comprehensive analysis of grazing-incidence SAXS data. In addition to a comparison with existing software packages, the structure of DPDAK and the possibilities and limitations are discussed.

X-ray ablation measurements and modeling for ICF applications

International Nuclear Information System (INIS)

Anderson, A.T.

1996-09-01

X-ray ablation of material from the first wall and other components of an ICF (Inertial Confinement Fusion) chamber is a major threat to the laser final optics. Material condensing on these optics after a shot may cause damage with subsequent laser shots. To ensure the successful operation of the ICF facility, removal rates must be predicted accurately. The goal for this dissertation is to develop an experimentally validated x-ray response model, with particular application to the National Ignition Facility (NIF). Accurate knowledge of the x-ray and debris emissions from ICF targets is a critical first step in the process of predicting the performance of the target chamber system. A number of 1-D numerical simulations of NIF targets have been run to characterize target output in terms of energy, angular distribution, spectrum, and pulse shape. Scaling of output characteristics with variations of both target yield and hohlraum wall thickness are also described. Experiments have been conducted at the Nova laser on the effects of relevant x-ray fluences on various materials. The response was diagnosed using post-shot examinations of the surfaces with scanning electron microscope and atomic force microscope instruments. Judgments were made about the dominant removal mechanisms for each material. Measurements of removal depths were made to provide data for the modeling. The finite difference ablation code developed here (ABLATOR) combines the thermomechanical response of materials to x-rays with models of various removal mechanisms. The former aspect refers to energy deposition in such small characteristic depths (∼ micron) that thermal conduction and hydrodynamic motion are significant effects on the nanosecond time scale. The material removal models use the resulting time histories of temperature and pressure-profiles, along with ancillary local conditions, to predict rates of surface vaporization and the onset of conditions that would lead to spallation

Proteins on surfaces investigated by microbeam grazing incidence small angle X-ray scattering

Energy Technology Data Exchange (ETDEWEB)

Gebhardt, Ronald; Riekel, Christian; Burghammer, Manfred [European Synchrotron Radiation Facility, B.P. 220, F-38043 Grenoble Cedex (France); Vendrely, Charlotte [Universite de Cergy-Pontoise, ERRMECE, F-95000, Cergy-Pontoise (France); Mueller-Buschbaum, Peter [TU Muenchen, Physik Department E13, Muenchen (Germany)

2009-07-01

Grazing incidence small angle scattering with a 1 micron x-ray beam ({mu}GISAXS) is applied to study structural ordering of casein micelles and fibroin in solution cast films. {mu}GISAXS scans provide the possibility to locate highly ordered areas and to investigate variation in the molecular packing. In the case of the casein micelles, ordered film structures have been generated by decreasing their natural size dispersion. While dynamic light scattering was used to characterize the different size fractions in solution, {mu}GISAXS and roughness are measured on the resulting casein films. GISAXS-Patterns are analyzed by simulations providing the dimension and nearest neighbor distances of casein micelles. In the case of fibroin, ordering of nano-fibers formed during the drying process is investigated. The experimental data are analyzed by simulations and compared to SEM, AFM and Raman scattering experiments.

X-ray astronomy

International Nuclear Information System (INIS)

Giacconi, R.; Gursky, H.

1974-01-01

This text contains ten chapters and three appendices. Following an introduction, chapters two through five deal with observational techniques, mechanisms for the production of x rays in a cosmic setting, the x-ray sky and solar x-ray emission. Chapters six through ten include compact x-ray sources, supernova remnants, the interstellar medium, extragalactic x-ray sources and the cosmic x-ray background. Interactions of x rays with matter, units and conversion factors and a catalog of x-ray sources comprise the three appendices. (U.S.)

Soft x-ray scanning microtomography with submicrometer resolution

International Nuclear Information System (INIS)

McNulty, I.; Haddad, W.S.; Trebes, J.E.; Anderson, E.H.

1995-01-01

Scanning soft x-ray microtomography was used to obtain high-resolution three-dimensional images of a microfabricated test object. Using a special rotation stage mounted on the scanning transmission x-ray microscope at the X1A beamline at the National Synchrotron Light Source, we recorded nine two-dimensional projections of the 3D test object over an angular range of -50 degree to +55 degree. The x-ray wavelength was 3.6 nm and the radiation dose to the object per projection was approximately 2x10 6 Gy. The object consisted of two gold patterns supported on transparent silicon nitride membranes, separated by 4.75 μm, with 100- to 300-nm-wide and 65-nm-thick features. We reconstructed a volumetric data set of the test object from the two-dimensional projections using an algebraic reconstruction technique algorithm. Features of the test object were resolved to ∼100 nm in transverse and longitudinal extent with low artifact in three-dimensional images rendered from the volumetric set

X-Ray Calorimeter Arrays for Astrophysics

Science.gov (United States)

Kilbourne, Caroline A.

2009-01-01

High-resolution x-ray spectroscopy is a powerful tool for studying the evolving universe. The grating spectrometers on the XMM and Chandra satellites started a new era in x-ray astronomy, but there remains a need for instrumentation that can provide higher spectral resolution with high throughput in the Fe-K band (around 6 keV) and can enable imaging spectroscopy of extended sources, such as supernova remnants and galaxy clusters. The instrumentation needed is a broad-band imaging spectrometer - basically an x-ray camera that can distinguish tens of thousands of x-ray colors. The potential benefits to astrophysics of using a low-temperature calorimeter to determine the energy of an incident x-ray photon via measurement of a small change in temperature was first articulated by S. H. Moseley over two decades ago. In the time since, technological progress has been steady, though full realization in an orbiting x-ray telescope is still awaited. A low-temperature calorimeter can be characterized by the type of thermometer it uses, and three types presently dominate the field. The first two types are temperature-sensitive resistors - semiconductors in the metal-insulator transition and superconductors operated in the superconducting-normal transition. The third type uses a paramagnetic thermometer. These types can be considered the three generations of x-ray calorimeters; by now each has demonstrated a resolving power of 2000 at 6 keV, but only a semiconductor calorimeter system has been developed to spaceflight readiness. The Soft X-ray Spectrometer on Astro-H, expected to launch in 2013, will use an array of silicon thermistors with I-IgTe x-ray absorbers that will operate at 50 mK. Both the semiconductor and superconductor calorimeters have been implemented in small arrays, kilo-pixel arrays of the superconducting calorimeters are just now being produced, and it is anticipated that much larger arrays will require the non-dissipative advantage of magnetic thermometers.

Impact of Lipid Oxidization on Vertical Structures and Electrostatics of Phospholipid Monolayers Revealed by Combination of Specular X-ray Reflectivity and Grazing-Incidence X-ray Fluorescence.

Science.gov (United States)

Korytowski, Agatha; Abuillan, Wasim; Makky, Ali; Konovalov, Oleg; Tanaka, Motomu

2015-07-30

The influence of phospholipid oxidization of floating monolayers on the structure perpendicular to the global plane and on the density profiles of ions near the lipid monolayer has been investigated by a combination of grazing incidence X-ray fluorescence (GIXF) and specular X-ray reflectivity (XRR). Systematic variation of the composition of the floating monolayers unravels changes in the thickness, roughness and electron density of the lipid monolayers as a function of molar fraction of oxidized phospholipids. Simultaneous GIXF measurements enable one to qualitatively determine the element-specific density profiles of monovalent (K(+) or Cs(+)) and divalent ions (Ca(2+)) in the vicinity of the interface in the presence and absence of two types of oxidized phospholipids (PazePC and PoxnoPC) with high spatial accuracy (±5 Å). We found the condensation of Ca(2+) near carboxylated PazePC was more pronounced compared to PoxnoPC with an aldehyde group. In contrast, the condensation of monovalent ions could hardly be detected even for pure oxidized phospholipid monolayers. Moreover, pure phospholipid monolayers exhibited almost no ion specific condensation near the interface. The quantitative studies with well-defined floating monolayers revealed how the elevation of lipid oxidization level alters the structures and functions of cell membranes.

High-Resolution X-ray Emission and X-ray Absorption Spectroscopy

NARCIS (Netherlands)

Groot, F.M.F. de

2000-01-01

In this review, high-resolution X-ray emission and X-ray absorption spectroscopy will be discussed. The focus is on the 3d transition-metal systems. To understand high-resolution X-ray emission and reso-nant X-ray emission, it is first necessary to spend some time discussing the X-ray absorption

Monte Carlo Investigation of Phosphor Screens for X-ray Imaging

International Nuclear Information System (INIS)

Lim, Chang Hwy; Cheong, Min Ho; Cho, Min Kook; Shon, Choel Soon; Kim, Ho Kyung

2006-01-01

In order to detect X rays with pixel detectors, there are two technical methods; a direct detection using photoconductive material that permits the conversion of the incident X rays into the signal charges, and an indirect detection using scintillation material that converts the incident X rays into the optical photons. Therefore, two-dimensional (2D) photosensitive pixel array is necessary for the indirect-detection scheme. Terbium-doped gadolinium oxysulfide (Gd 2 O 2 S:Tb) phosphor screen is the most popular X-ray converter, and often employed to the digital radiographic system owing to its well-known technology and easy handling in size, thickness, and flexibility. Furthermore, the cost is effective. In cascaded imaging chains of the indirect-detection system, the phosphor screen is served as the first stage. Since the image signal-to-noise ratio (SNR) is irreversible through the cascaded system, the phosphor screen is largely responsible for the eventual image quality. For the various radiation qualities suggested by IEC (International Electrotechnical Commission, Report 1267), we have investigated important physical quantities of Gd 2 O 2 S:Tb screen with a wide range of coverages (34 . 135 mg/cm 2 ) by using Monte Carlo calculations. The results will be useful for the optimal design of digital X-ray imaging systems

Determinations of silicon and phosphorus in rice planted on a district of high incidence of amyotrophic lateral sclerosis by neutron activation and X-ray fluorescence analyses

Energy Technology Data Exchange (ETDEWEB)

Mizumoto, Yoshihiko; Ishikawa, Teruumi; Kusakabe, Toshio; Katsurayama, Kousuke (Kinki Univ., Higashi-Osaka, Osaka (Japan)); Iwata, Shiro

1989-12-01

Silicon and phosphorus contents in polished and unpolished rice planted on a district of high incidence of amyotrophic lateral sclerosis (ALS) have been determined by neutron activation and X-ray fluorescence methods, and compared with those from control areas. In the neutron activation analysis, {beta}-ray spectra of {sup 32}P produced by the {sup 31}P(n, {gamma}){sup 32}P reaction on polished and unpolished rice were measured with a low background {beta}-ray spectrometer. In the X-ray fluorescence analysis, characteristic X-ray were analyzed with a wavelength dispersive X-ray fluorescence spectrometer. Silicon contents in polished and unpolished rice from the ALS area are 42 {mu}g.g{sup -1} and 370 {mu}g.g{sup -1}, respectively, and the corresponding phosphorus contents are 1210 {mu}g.g{sup -1}, and 3370 {mu}g.g{sup -1}, respectively. The data for ALS area are equal to those for the control area within atandard deviation. (author).

Determinations of silicon and phosphorus in rice planted on a district of high incidence of amyotrophic lateral sclerosis by neutron activation and X-ray fluorescence analyses

International Nuclear Information System (INIS)

Mizumoto, Yoshihiko; Ishikawa, Teruumi; Kusakabe, Toshio; Katsurayama, Kousuke; Iwata, Shiro.

1989-01-01

Silicon and phosphorus contents in polished and unpolished rice planted on a district of high incidence of amyotrophic lateral sclerosis (ALS) have been determined by neutron activation and X-ray fluorescence methods, and compared with those from control areas. In the neutron activation analysis, β-ray spectra of 32 P produced by the 31 P(n, γ) 32 P reaction on polished and unpolished rice were measured with a low background β-ray spectrometer. In the X-ray fluorescence analysis, characteristic X-ray were analyzed with a wavelength dispersive X-ray fluorescence spectrometer. Silicon contents in polished and unpolished rice from the ALS area are 42 μg.g -1 and 370 μg.g -1 , respectively, and the corresponding phosphorus contents are 1210 μg.g -1 , and 3370 μg.g -1 , respectively. The data for ALS area are equal to those for the control area within atandard deviation. (author)

The microscopic structure of charge density waves in underdoped YBa2Cu3O6.54 revealed by X-ray diffraction

DEFF Research Database (Denmark)

Forgan, E.M.; Blackburn, E.; Holmes, A.T.

2015-01-01

Charge density wave (CDW) order appears throughout the underdoped high-temperature cuprate superconductors, but the underlying symmetry breaking and the origin of the CDW remain unclear. We use X-ray diffraction to determine the microscopic structure of the CDWs in an archetypical cuprate YBa2Cu3O6...... oxygen atoms have the largest displacements, perpendicular to the CuO2 planes. Our results allow many electronic properties of the underdoped cuprates to be understood. For instance, the CDWs will lead to local variations in the electronic structure, giving an explicit explanation of density-wave states...

Microscopic and flow cytometric study of micronuclei in iododeoxyuridine labelled cells irradiated with soft X-rays