Combined evaluation of grazing incidence X-ray fluorescence and X-ray reflectivity data for improved profiling of ultra-shallow depth distributions

Energy Technology Data Exchange (ETDEWEB)

Ingerle, D., E-mail: dingerle@ati.ac.at [Atominstitut, Vienna University of Technology, Stadionallee 2, A-1020 Vienna (Austria); Meirer, F. [Inorganic Chemistry and Catalysis, Debye Institute for Nanomaterials Science, Utrecht University, Universiteitsweg 99, 3584 CG Utrecht (Netherlands); Pepponi, G.; Demenev, E.; Giubertoni, D. [MiNALab, CMM-irst, Fondazione Bruno Kessler, Via Sommarive 18, I-38050 Povo (Italy); Wobrauschek, P.; Streli, C. [Atominstitut, Vienna University of Technology, Stadionallee 2, A-1020 Vienna (Austria)

2014-09-01

The continuous downscaling of the process size for semiconductor devices pushes the junction depths and consequentially the implantation depths to the top few nanometers of the Si substrate. This motivates the need for sensitive methods capable of analyzing dopant distribution, total dose and possible impurities. X-ray techniques utilizing the external reflection of X-rays are very surface sensitive, hence providing a non-destructive tool for process analysis and control. X-ray reflectometry (XRR) is an established technique for the characterization of single- and multi-layered thin film structures with layer thicknesses in the nanometer range. XRR spectra are acquired by varying the incident angle in the grazing incidence regime while measuring the specular reflected X-ray beam. The shape of the resulting angle-dependent curve is correlated to changes of the electron density in the sample, but does not provide direct information on the presence or distribution of chemical elements in the sample. Grazing Incidence XRF (GIXRF) measures the X-ray fluorescence induced by an X-ray beam incident under grazing angles. The resulting angle dependent intensity curves are correlated to the depth distribution and mass density of the elements in the sample. GIXRF provides information on contaminations, total implanted dose and to some extent on the depth of the dopant distribution, but is ambiguous with regard to the exact distribution function. Both techniques use similar measurement procedures and data evaluation strategies, i.e. optimization of a sample model by fitting measured and calculated angle curves. Moreover, the applied sample models can be derived from the same physical properties, like atomic scattering/form factors and elemental concentrations; a simultaneous analysis is therefore a straightforward approach. This combined analysis in turn reduces the uncertainties of the individual techniques, allowing a determination of dose and depth profile of the implanted

Aplanatic telescopes based on Schwarzschild optical configuration: from grazing incidence Wolter-like x-ray optics to Cherenkov two-mirror normal incidence telescopes

Science.gov (United States)

Sironi, Giorgia

2017-09-01

At the beginning of XX century Karl Schwarzschild defined a method to design large-field aplanatic telescopes based on the use of two aspheric mirrors. The approach was then refined by Couder (1926) who, in order to correct for the astigmatic aberration, introduced a curvature of the focal plane. By the way, the realization of normal-incidence telescopes implementing the Schwarzschild aplanatic configuration has been historically limited by the lack of technological solutions to manufacture and test aspheric mirrors. On the other hand, the Schwarzschild solution was recovered for the realization of coma-free X-ray grazing incidence optics. Wolter-like grazing incidence systems are indeed free of spherical aberration, but still suffer from coma and higher order aberrations degrading the imaging capability for off-axis sources. The application of the Schwarzschild's solution to X-ray optics allowed Wolter to define an optical system that exactly obeys the Abbe sine condition, eliminating coma completely. Therefore these systems are named Wolter-Schwarzschild telescopes and have been used to implement wide-field X-ray telescopes like the ROSAT WFC and the SOHO X-ray telescope. Starting from this approach, a new class of X-ray optical system was proposed by Burrows, Burg and Giacconi assuming polynomials numerically optimized to get a flat field of view response and applied by Conconi to the wide field x-ray telescope (WFXT) design. The Schwarzschild-Couder solution has been recently re-discovered for the application to normal-incidence Cherenkov telescopes, thanks to the suggestion by Vassiliev and collaborators. The Italian Institute for Astrophysics (INAF) realized the first Cherenkov telescope based on the polynomial variation of the Schwarzschild configuration (the so-called ASTRI telescope). Its optical qualification was successfully completed in 2016, demonstrating the suitability of the Schwarzschild-like configuration for the Cherenkov astronomy requirements

Multiple scattering in grazing-incidence X-ray diffraction: impact on lattice-constant determination in thin films

Energy Technology Data Exchange (ETDEWEB)

Resel, Roland, E-mail: roland.resel@tugraz.at; Bainschab, Markus; Pichler, Alexander [Graz University of Technology, Graz (Austria); Dingemans, Theo [Delft University of Technology, Delft (Netherlands); Simbrunner, Clemens [Johannes Kepler University, Linz (Austria); University of Bremen, Bremen (Germany); Stangl, Julian [Johannes Kepler University, Linz (Austria); Salzmann, Ingo [Humboldt University, Berlin (Germany)

2016-04-20

The use of grazing-incidence X-ray diffraction to determine the crystal structure from thin films requires accurate positions of Bragg peaks. Refraction effects and multiple scattering events have to be corrected or minimized. Dynamical scattering effects are observed in grazing-incidence X-ray diffraction experiments using an organic thin film of 2,2′:6′,2′′-ternaphthalene grown on oxidized silicon as substrate. Here, a splitting of all Bragg peaks in the out-of-plane direction (z-direction) has been observed, the magnitude of which depends both on the incidence angle of the primary beam and the out-of-plane angle of the scattered beam. The incident angle was varied between 0.09° and 0.25° for synchrotron radiation of 10.5 keV. This study reveals comparable intensities of the split peaks with a maximum for incidence angles close to the critical angle of total external reflection of the substrate. This observation is rationalized by two different scattering pathways resulting in diffraction peaks at different positions at the detector. In order to minimize the splitting, the data suggest either using incident angles well below the critical angle of total reflection or angles well above, which sufficiently attenuates the contributions from the second scattering path. This study highlights that the refraction of X-rays in (organic) thin films has to be corrected accordingly to allow for the determination of peak positions with sufficient accuracy. Based thereon, a reliable determination of the lattice constants becomes feasible, which is required for crystallographic structure solutions from thin films.

X-ray grazing incidence diffraction from multilayers

Energy Technology Data Exchange (ETDEWEB)

Tixier, S.; Boeni, P.; Swygenhoven, H. van; Horisberger, M. [Paul Scherrer Inst. (PSI), Villigen (Switzerland)

1997-09-01

Grazing incidence scattering geometries using synchrotron radiation have been applied in order to characterise the roughness profiles and the structural coherence of multilayers. The lateral correlation length of the roughness profiles was evaluated using diffuse reflectivity in the `out of plane` geometry. This type of measurement is the only diffuse reflectivity technique allowing large lateral momentum transfer. It is typically suitable for correlation lengths smaller than 1000 A. The lateral structural coherence length of Ni{sub 3}Al/Ni multilayers as a function of the layer thickness was obtained by grazing incidence diffraction (GID). 3 figs., 1 ref.

Stress measurements by multi-reflection grazing-incidence X-ray diffraction method (MGIXD) using different radiation wavelengths and different incident angles

International Nuclear Information System (INIS)

Marciszko, Marianna; Baczmański, Andrzej; Braham, Chedly; Wróbel, Mirosław; Wroński, Sebastian; Cios, Grzegorz

2017-01-01

The presented study introduces the development of the multi-reflection grazing-incidence X-ray diffraction method (MGIXD) for residual stress determination. The proposed new methodology is aimed at obtaining more reliable experimental data and increasing the depth of non-destructive stress determination below the sample surface. To verify proposed method measurements were performed on a classical X-ray diffractometer (Cu Kα radiation) and using synchrotron radiation (three different wavelengths: λ = 1.2527 Å, λ = 1.5419 Å and λ = 1.7512 Å). The Al2017 alloy subjected to three different surface treatments was investigated in this study. The obtained results showed that the proposed development of MGIXD method, in which not only different incident angles but also different wavelengths of X-ray are used, can be successfully applied for residual stress determination, especially when stress gradients are present in the sample.

Advanced laser-backlit grazing-incidence x-ray imaging systems for inertial confinement fusion research. II. Tolerance analysis

International Nuclear Information System (INIS)

Bennett, Guy R.; Folta, James A.

2001-01-01

Two example ultrahigh-spatial resolution laser-backlit grazing-incidence x-ray microscope designs for inertial confinement fusion (ICF) research have been described [Appl. Opt. 40, 4570 (2001)]. Here details of fabrication, assembly, and optical surface errors that are characteristic of present state-of-the-art superpolished multilayer-coated spherical mirrors are given. They indicate that good image qualities can be expected; in particular, <0.5-μm spatial resolution at very high x-ray energies (up to 25 keV) appears to be feasible. Existing ICF imaging diagnostics approach ∼2 μm spatial at low (<2 keV) energy. The improvement in resolution compared with that of other grazing-incidence devices is attributed to a fortuitous residual on-axis aberration dependence on short wavelengths; recent advances in mirror fabrication, including a new thin-film deposition technique to correct figure errors precisely in one dimension; and novel design. For even higher resolution, a means of creating precise aspherical mirrors of spheric-quality microroughness may be possible by use of the same deposition technique

X-ray radiation damage of organic semiconductor thin films during grazing incidence diffraction experiments

Energy Technology Data Exchange (ETDEWEB)

Neuhold, A., E-mail: alfred.neuhold@tugraz.at [Institute of Solid State Physics, Graz University of Technology, Graz (Austria); Novak, J.; Flesch, H.-G.; Moser, A.; Djuric, T. [Institute of Solid State Physics, Graz University of Technology, Graz (Austria); Grodd, L.; Grigorian, S.; Pietsch, U. [Institute of Physics, University Siegen (Germany); Resel, R. [Institute of Solid State Physics, Graz University of Technology, Graz (Austria)

2012-08-01

Since modern synchrotrons with highly intense X-ray beams are in use to investigate organic materials, the stability of soft matter materials during beam exposure is a crucial issue. Grazing incidence X-ray diffraction and specular X-ray reflectivity measurements were performed on thin films of organic semiconducting materials, like poly(3-hexylthiophene) (P3HT), sexithiophene and pentacene. These films were irradiated with an average flux density between 10{sup 15} and 10{sup 16} photons/(s mm{sup 2}) and evidenced a different stability in synchrotron X-ray radiation. The semi-crystalline P3HT showed a clear intensity decrease of the 1 0 0 Bragg peak and 0 2 0 Bragg peak compared to the rather stable diffraction features of the molecular crystals sexithiophene and pentacene. The difference in synchrotron X-ray radiation stability is explained by the interaction of the X-ray beam with the individual chemical components in the molecules as well as by the different crystallinities of the materials. Furthermore, the semi-crystalline P3HT film exhibited an increase of film thickness after irradiation and the surface roughness slightly decreased. To summarize, this study shows a strong influence of synchrotron X-ray radiation to specific organic thin films like e.g. P3HT, while others like pentacene and sexithiophene are observed as quite stable.

Adjustable Grazing Incidence X-ray Optics with 0.5 Arc Second Resolution

Science.gov (United States)

Reid, Paul

We seek to develop adjustable grazing incidence optics for x-ray astronomy. The goal of this development is thin, lightweight mirrors with angular resolution of 0.5 arc seconds, comparable to the Chandra X-ray Observatory. The new mirror design consists of thin segments of a Wolter-I grazing incidence mirror, with piezo-electric material deposited directly on the back surface of the mirror. Depositing a pattern of independently addressable electrodes on top of the piezoelectric material produces an array of independent piezo cells. Energizing a particular cell introduces a localized deformation in the mirror without the need for a reaction structure. By applying the appropriate voltage to the piezo cells, it is possible to correct mirror figure errors that result from mirror fabrication, gravity release, mounting, and thermal effects. Because the thin mirrors segments are lightweight, they can be densely nested to produce collecting area thirty times that of Chandra, on an affordably priced mission. This Supporting Technology program is a follow-on to an existing APRA program. In the existing program we demonstrated the first successful deposition of piezoelectric material on thermally formed glass substrates. We showed that the localized deformations produced by the piezo cells match finite element predictions, and the piezo cell adjustment range meets requirements necessary to achieve the desired figure correction. We have also shown through simulation that representative mirror figure errors can be corrected via modeled influence functions to achieve 0.5 arc sec imaging performance. This provides a firm foundation on which to develop further the technology. We will continue to optimize the deposition of thin piezoelectric films onto thermally formed glass and electroplated metal mirror segments to improve yield and manufacturability. We will deposit piezoelectric material onto conical mirror segments and demonstrate figure correction in agreement with prediction

Grazing Incidence X-ray Scattering and Diffraction

Indian Academy of Sciences (India)

IAS Admin

several materials as a function of angle of incidence, αi with X-rays of wavelength ..... are several advantages of using this formulation for the description of surface ..... print of the surface (as shown at the botton of Figure. 5). A Soller collimator ...

Grazing incidence small angle X-ray scattering study of silver nanoparticles in ion-exchanged glasses

Energy Technology Data Exchange (ETDEWEB)

Cheng, Weidong, E-mail: 57399942@qq.com [College of Materials Science and Engineering, Qiqihar University, Qiqihar 161006 (China); Wu, Zhaojun [Department of Practice Teaching and Equipment Management, Qiqihar University, Qiqihar 161006 (China); Gu, Xiaohua [College of Materials Science and Engineering, Qiqihar University, Qiqihar 161006 (China); Xing, Xueqing; Mo, Guang [Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049 (China); Wu, Zhonghua, E-mail: wuzh@ihep.ac.cn [Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049 (China)

2015-05-15

The size and distribution of silver nanoparticles in ion-exchanged silicate glass induced by thermal treatments in air at different temperatures were investigated by means of grazing incidence small angle X-ray scattering technique, X-ray diffraction and optical absorption spectra. Silver–sodium ion exchange of soda-lime silicate glasses was done at 350 °C for 240 min, then the samples were treated by thermal annealing in air at different temperatures 400, 500 and 550 °C, respectively, for 1 h. After the annealing treatment above 400 °C for 1 h, smaller Ag nanoparticles occurred, together with bigger ones. Both dissolution of smaller Ag nanoparticles and diffusion of larger ones are discussed in these stages of annealing in this contribution.

X-ray grazing incidence study of inhomogeneous strain relaxation in Si/SiGe wires

International Nuclear Information System (INIS)

Hesse, A.; Zhuang, Y.; Holy, V.; Stangl, J.; Zerlauth, S.; Schaeffler, F.; Bauer, G.; Darowski, N.; Pietsch, U.

2003-01-01

The elastic strain relaxation in a series of dry-etched periodic multilayer Si/SiGe wire samples with different etching depths was investigated systematically by means of grazing incidence diffraction (GID). The samples were patterned by holographic lithography and reactive ion etching from a Si/SiGe superlattice grown by molecular beam epitaxy. Scanning electron microscopy and atomic force microscopy were employed to obtain information on the shape of the wires. The inhomogeneous strain distribution in the etched wires and in the non-etched part of the multilayers was derived by means of finite element calculations which were used as an input for simulations of the scattered X-ray intensities in depth dependent GID. The theoretical calculations for the scattered intensities are based on distorted-wave Born approximation. The unperturbed scattering potential was chosen with a reduced optical density corresponding to the ratio of wire width and wire period, in order to reflect the main interaction between the incident X-rays and the patterned samples. The calculations are in good agreement with the experimental data demonstrating the variation of strain relaxation with depth

On the determination of stress profiles in expanded austenite by grazing incidence X-ray diffraction and successive layer removal

DEFF Research Database (Denmark)

Fernandes, Frederico Augusto Pires; Christiansen, Thomas L.; Winther, Grethe

2015-01-01

Surface layers of expanded austenite resulting from nitriding typically exhibit large gradients in residual stress and composition. Evaluation of residual-stress profiles is explored by means of grazing incidence X-ray diffraction (GI-XRD), probing shallow depths, combined with successive layer...... removal. Several factors complicating the stress determination are analysed and discussed: (1) ghost stresses arising from a small variation in the shallow information depths probed with GI-XRD, (2) selection of the grain interaction model used to calculate the X-ray elastic constants for conversion...

Marshall Grazing Incidence X-ray Spectrometer (MaGIXS) Slit-Jaw Imaging System

Science.gov (United States)

Wilkerson, P.; Champey, P. R.; Winebarger, A. R.; Kobayashi, K.; Savage, S. L.

2017-12-01

The Marshall Grazing Incidence X-ray Spectrometer is a NASA sounding rocket payload providing a 0.6 - 2.5 nm spectrum with unprecedented spatial and spectral resolution. The instrument is comprised of a novel optical design, featuring a Wolter1 grazing incidence telescope, which produces a focused solar image on a slit plate, an identical pair of stigmatic optics, a planar diffraction grating and a low-noise detector. When MaGIXS flies on a suborbital launch in 2019, a slit-jaw camera system will reimage the focal plane of the telescope providing a reference for pointing the telescope on the solar disk and aligning the data to supporting observations from satellites and other rockets. The telescope focuses the X-ray and EUV image of the sun onto a plate covered with a phosphor coating that absorbs EUV photons, which then fluoresces in visible light. This 10-week REU project was aimed at optimizing an off-axis mounted camera with 600-line resolution NTSC video for extremely low light imaging of the slit plate. Radiometric calculations indicate an intensity of less than 1 lux at the slit jaw plane, which set the requirement for camera sensitivity. We selected a Watec 910DB EIA charge-coupled device (CCD) monochrome camera, which has a manufacturer quoted sensitivity of 0.0001 lux at F1.2. A high magnification and low distortion lens was then identified to image the slit jaw plane from a distance of approximately 10 cm. With the selected CCD camera, tests show that at extreme low-light levels, we achieve a higher resolution than expected, with only a moderate drop in frame rate. Based on sounding rocket flight heritage, the launch vehicle attitude control system is known to stabilize the instrument pointing such that jitter does not degrade video quality for context imaging. Future steps towards implementation of the imaging system will include ruggedizing the flight camera housing and mounting the selected camera and lens combination to the instrument structure.

Grazing incidence X-ray absorption characterization of amorphous Zn-Sn-O thin film

Science.gov (United States)

Moffitt, S. L.; Ma, Q.; Buchholz, D. B.; Chang, R. P. H.; Bedzyk, M. J.; Mason, T. O.

2016-05-01

We report a surface structure study of an amorphous Zn-Sn-O (a-ZTO) transparent conducting film using the grazing incidence X-ray absorption spectroscopy technique. By setting the measuring angles far below the critical angle at which the total external reflection occurs, the details of the surface structure of a film or bulk can be successfully accessed. The results show that unlike in the film where Zn is severely under coordinated (N < 4), it is fully coordinated (N = 4) near the surface while the coordination number around Sn is slightly smaller near the surface than in the film. Despite a 30% Zn doping, the local structure in the film is rutile-like.

Grazing incidence X-ray fluorescence analysis of buried interfaces in periodically structured crystalline silicon thin-film solar cells

Energy Technology Data Exchange (ETDEWEB)

Eisenhauer, David; Preidel, Veit; Becker, Christiane [Young Investigator Group Nanostructured Silicon for Photovoltaic and Photonic Implementations (Nano-SIPPE), Helmholtz-Zentrum Berlin fuer Materialien und Energie GmbH, Berlin (Germany); Pollakowski, Beatrix; Beckhoff, Burkhard [Physikalisch-Technische Bundesanstalt, Berlin (Germany); Baumann, Jonas; Kanngiesser, Birgit [Institut fuer Optik und Atomare Physik, Technische Universitaet Berlin (Germany); Amkreutz, Daniel; Rech, Bernd [Institut Silizium Photovoltaik, Helmholtz-Zentrum Berlin fuer Materialien und Energie GmbH, Berlin (Germany); Back, Franziska; Rudigier-Voigt, Eveline [SCHOTT AG, Mainz (Germany)

2015-03-01

We present grazing incidence X-ray fluorescence (GIXRF) experiments on 3D periodically textured interfaces of liquid phase crystallized silicon thin-film solar cells on glass. The influence of functional layers (SiO{sub x} or SiO{sub x}/SiC{sub x}) - placed between glass substrate and silicon during crystallization - on the final carbon and oxygen contaminations inside the silicon was analyzed. Baring of the buried structured silicon surface prior to GIXRF measurement was achieved by removal of the original nano-imprinted glass substrate by wet-chemical etching. A broad angle of incidence distribution was determined for the X-ray radiation impinging on this textured surface. Optical simulations were performed in order to estimate the incident radiation intensity on the structured surface profile considering total reflection and attenuation effects. The results indicate a much lower contamination level for SiO{sub x} compared to the SiO{sub x}/SiC{sub x} interlayers, and about 25% increased contamination when comparing structured with planar silicon layers, both correlating with the corresponding solar cell performances. (copyright 2015 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim)

Measuring helium bubble diameter distributions in tungsten with grazing incidence small angle x-ray scattering (GISAXS)

Science.gov (United States)

Thompson, M.; Kluth, P.; Doerner, R. P.; Kirby, N.; Riley, D.; Corr, C. S.

2016-02-01

Grazing incidence small angle x-ray scattering was performed on tungsten samples exposed to helium plasma in the MAGPIE and Pisces-A linear plasma devices to measure the size distributions of resulting helium nano-bubbles. Nano-bubbles were fitted assuming spheroidal particles and an exponential diameter distribution. These particles had mean diameters between 0.36 and 0.62 nm. Pisces-A exposed samples showed more complex patterns, which may suggest the formation of faceted nano-bubbles or nano-scale surface structures.

Grazing incidence optics; Proceedings of the Meeting, Orlando, FL, Apr. 3, 4, 1986

Science.gov (United States)

Osantowski, John F. (Editor); Van Speybroeck, Leon (Editor)

1986-01-01

Papers are presented on the diffraction-limited performance of grazing incidence optical systems; transverse ray aberrations of Wolter type 1 telescopes; hybrid X-ray telescope systems; surface characterization of grazing incidence optics in the extreme UV and X-ray regions; and the surface roughness properties of synchrotron radiation optics. Topics discussed include the simulation of free-abrasive grinding of grazing incidence mirrors with vertical-honing and flexible blades; mirrors for the Extreme Ultraviolet Explorer; the design and development of conical X-ray imaging mirrors; thermal loading considerations for synchrotron radiation mirrors; and grazing incidence optics for synchrotron radiation insertion-device beams. Consideration is given to the interpretation of glancing incidence scattering measurements; damage processes in short wavelength coated FEL optics; the replication of grain incidence optics; and the assembly and alignment of the Technology Mirror Assembly.

First combined total reflection X-ray fluorescence and grazing incidence X-ray absorption spectroscopy characterization of aeolian dust archived in Antarctica and Alpine deep ice cores

Energy Technology Data Exchange (ETDEWEB)

Cibin, G. [Diamond Light Source, Harwell Science and Innovation Campus, Didcot, Oxon OX110DE (United Kingdom); IMONT/EIM, Ente Italiano della Montagna, P.za dei Caprettari 70, 00176 Roma (Italy); Universita' degli Studi di Roma Tre, Dipartimento di Scienze Geologiche, L.go S. Leonardo Murialdo 1, 00146 Roma (Italy)], E-mail: giannantonio.cibin@diamond.ac.uk; Marcelli, A. [INFN - Laboratori Nazionali di Frascati, P.O. Box 13, 00044 Frascati (Roma) (Italy); Maggi, V. [Universita degli Studi di Milano-Bicocca, Dipartimento di Scienze dell' Ambiente e del Territorio, Piazza della Scienza 1, 20126 Milano (Italy); Sala, M. [Universita degli Studi di Milano-Bicocca, Dipartimento di Scienze dell' Ambiente e del Territorio, Piazza della Scienza 1, 20126 Milano (Italy); Universita degli Studi di Milano, Dipartimento di Scienze della Terra ' A. Desio' , Sez. Mineralogia, Via Mangiagalli 34, 20133 Milano (Italy); Marino, F.; Delmonte, B. [Universita degli Studi di Milano-Bicocca, Dipartimento di Scienze dell' Ambiente e del Territorio, Piazza della Scienza 1, 20126 Milano (Italy); Albani, S. [Universita degli Studi di Milano-Bicocca, Dipartimento di Scienze dell' Ambiente e del Territorio, Piazza della Scienza 1, 20126 Milano (Italy); Universita degli Studi di Siena, Dottorato in Scienze Polari, via Laterina 8, 53100 Siena (Italy); Pignotti, S. [IMONT/EIM, Ente Italiano della Montagna, P.za dei Caprettari 70, 00176 Roma (Italy)

2008-12-15

Aeolian mineral dust archived in polar and mid latitude ice cores represents a precious proxy for assessing environmental and climatic variations at different timescales. In this respect, the identification of dust mineralogy plays a key role. In this work we performed the first preliminary X-ray absorption spectroscopy (XAS) experiments on mineral dust particles extracted from Antarctic and from Alpine firn cores using grazing incidence geometry at the Fe K-edge. A dedicated high vacuum experimental chamber was set up for normal-incidence and total-reflection X-Ray Fluorescence and Absorption Spectroscopy analyses on minor amounts of mineral materials at the Stanford Synchrotron Radiation Laboratory. Results show that this experimental technique and protocol allows recognizing iron inclusion mineral fraction on insoluble dust in the 1-10 {mu}g range.

First combined total reflection X-ray fluorescence and grazing incidence X-ray absorption spectroscopy characterization of aeolian dust archived in Antarctica and Alpine deep ice cores

International Nuclear Information System (INIS)

Cibin, G.; Marcelli, A.; Maggi, V.; Sala, M.; Marino, F.; Delmonte, B.; Albani, S.; Pignotti, S.

2008-01-01

Aeolian mineral dust archived in polar and mid latitude ice cores represents a precious proxy for assessing environmental and climatic variations at different timescales. In this respect, the identification of dust mineralogy plays a key role. In this work we performed the first preliminary X-ray absorption spectroscopy (XAS) experiments on mineral dust particles extracted from Antarctic and from Alpine firn cores using grazing incidence geometry at the Fe K-edge. A dedicated high vacuum experimental chamber was set up for normal-incidence and total-reflection X-Ray Fluorescence and Absorption Spectroscopy analyses on minor amounts of mineral materials at the Stanford Synchrotron Radiation Laboratory. Results show that this experimental technique and protocol allows recognizing iron inclusion mineral fraction on insoluble dust in the 1-10 μg range

On the determination of stress profiles in expanded austenite by grazing incidence X-ray diffraction and successive layer removal

International Nuclear Information System (INIS)

Fernandes, Frederico A.P.; Christiansen, Thomas L.; Winther, Grethe; Somers, Marcel A.J.

2015-01-01

Surface layers of expanded austenite resulting from nitriding typically exhibit large gradients in residual stress and composition. Evaluation of residual-stress profiles is explored by means of grazing incidence X-ray diffraction (GI-XRD), probing shallow depths, combined with successive layer removal. Several factors complicating the stress determination are analysed and discussed: (1) ghost stresses arising from a small variation in the shallow information depths probed with GI-XRD, (2) selection of the grain interaction model used to calculate the X-ray elastic constants for conversion of lattice strains into residual stress and (3) the composition dependence of these elastic constants

Interest of the grazing X ray diffraction to study the evolution of materials under irradiation: behaviour of zirconia under irradiation; Utilisation de la diffraction des rayons X en incidence rasante pour l'etude des solides irradies: application a la zircone

Energy Technology Data Exchange (ETDEWEB)

Simeone, D.; Gosset, D.; Bechade, J.L. [CEA Saclay, Dept. des Materiaux pour le Nucleaire DMN, 91 - Gif-sur-Yvette (France)

2001-07-01

This document was written to show that grazing X ray diffraction may be a powerful tool to study irradiation damages induced by ion beams in materials. Taking advantage of an asymmetric geometry and a curved detector, it is possible to analyse accurately diffraction diagrams at low angles by taking into account the specific effects induced by the grazing incidence. The interest of grazing incidence is to control the penetration depth of X rays. Such possibility allows to separate effects induced by damages (displacement cascades) and the implantation peak (elastic deformation of the lattice due to the insertion of projectile ions in the matrix). A Rietveld analysis on grazing X ray diagrams shows clearly that displacement cascades induce a phase transition on irradiated zirconia. (authors)

Interest of the grazing X ray diffraction to study the evolution of materials under irradiation: behaviour of zirconia under irradiation; Utilisation de la diffraction des rayons X en incidence rasante pour l'etude des solides irradies: application a la zircone

Energy Technology Data Exchange (ETDEWEB)

Simeone, D; Gosset, D; Bechade, J L [CEA Saclay, Dept. des Materiaux pour le Nucleaire DMN, 91 - Gif-sur-Yvette (France)

2001-07-01

This document was written to show that grazing X ray diffraction may be a powerful tool to study irradiation damages induced by ion beams in materials. Taking advantage of an asymmetric geometry and a curved detector, it is possible to analyse accurately diffraction diagrams at low angles by taking into account the specific effects induced by the grazing incidence. The interest of grazing incidence is to control the penetration depth of X rays. Such possibility allows to separate effects induced by damages (displacement cascades) and the implantation peak (elastic deformation of the lattice due to the insertion of projectile ions in the matrix). A Rietveld analysis on grazing X ray diagrams shows clearly that displacement cascades induce a phase transition on irradiated zirconia. (authors)

Oxide surfaces and metal/oxide interfaces studied by grazing incidence X-ray scattering

Science.gov (United States)

Renaud, Gilles

Experimental determinations of the atomic structure of insulating oxide surfaces and metal/oxide interfaces are scarce, because surface science techniques are often limited by the insulating character of the substrate. Grazing incidence X-ray scattering (GIXS), which is not subject to charge effects, can provide very precise information on the atomic structure of oxide surfaces: roughness, relaxation and reconstruction. It is also well adapted to analyze the atomic structure, the registry, the misfit relaxation, elastic or plastic, the growth mode and the morphology of metal/oxide interfaces during their growth, performed in situ. GIXS also allows the analysis of thin films and buried interfaces, in a non-destructive way, yielding the epitaxial relationships, and, by variation of the grazing incidence angle, the lattice parameter relaxation along the growth direction. On semi-coherent interfaces, the existence of an ordered network of interfacial misfit dislocations can be demonstrated, its Burger's vector determined, its ordering during in situ annealing cycles followed, and sometimes even its atomic structure can be addressed. Careful analysis during growth allows the modeling of the dislocation nucleation process. This review emphasizes the new information that GIXS can bring to oxide surfaces and metal/oxide interfaces by comparison with other surface science techniques. The principles of X-ray diffraction by surfaces and interfaces are recalled, together with the advantages and properties of grazing angles. The specific experimental requirements are discussed. Recent results are presented on the determination of the atomic structure of relaxed or reconstructed oxide surfaces. A description of results obtained during the in situ growth of metal on oxide surfaces is also given, as well as investigations of thick metal films on oxide surfaces, with lattice parameter misfit relaxed by an array of dislocations. Recent work performed on oxide thin films having

Penetration Depth and Defect Image Contrast Formation in Grazing-Incidence X-ray Topography of 4H-SiC Wafers

Science.gov (United States)

Yang, Yu; Guo, Jianqiu; Goue, Ouloide Yannick; Kim, Jun Gyu; Raghothamachar, Balaji; Dudley, Michael; Chung, Gill; Sanchez, Edward; Manning, Ian

2018-02-01

Synchrotron x-ray topography in grazing-incidence geometry is useful for discerning defects at different depths below the crystal surface, particularly for 4H-SiC epitaxial wafers. However, the penetration depths measured from x-ray topographs are much larger than theoretical values. To interpret this discrepancy, we have simulated the topographic contrast of dislocations based on two of the most basic contrast formation mechanisms, viz. orientation and kinematical contrast. Orientation contrast considers merely displacement fields associated with dislocations, while kinematical contrast considers also diffraction volume, defined as the effective misorientation around dislocations and the rocking curve width for given diffraction vector. Ray-tracing simulation was carried out to visualize dislocation contrast for both models, taking into account photoelectric absorption of the x-ray beam inside the crystal. The results show that orientation contrast plays the key role in determining both the contrast and x-ray penetration depth for different types of dislocation.

Grazing incidence x-ray diffraction at free-standing nanoscale islands: fine structure of diffuse scattering

International Nuclear Information System (INIS)

Grigoriev, D; Hanke, M; Schmidbauer, M; Schaefer, P; Konovalov, O; Koehler, R

2003-01-01

We have investigated the x-ray intensity distribution around 220 reciprocal lattice point in case of grazing incidence diffraction at SiGe nanoscale free-standing islands grown on Si(001) substrate by LPE. Experiments and computer simulations based on the distorted wave Born approximation utilizing the results of elasticity theory obtained by FEM modelling have been carried out. The data reveal fine structure in the distribution of scattered radiation with well-pronounced maxima and complicated fringe pattern. Explanation of the observed diffraction phenomena in their relation to structure and morphology of the island is given. An optimal island model including its shape, size and Ge spatial distribution was elaborated

Proteins on surfaces investigated by microbeam grazing incidence small angle X-ray scattering

Energy Technology Data Exchange (ETDEWEB)

Gebhardt, Ronald; Riekel, Christian; Burghammer, Manfred [European Synchrotron Radiation Facility, B.P. 220, F-38043 Grenoble Cedex (France); Vendrely, Charlotte [Universite de Cergy-Pontoise, ERRMECE, F-95000, Cergy-Pontoise (France); Mueller-Buschbaum, Peter [TU Muenchen, Physik Department E13, Muenchen (Germany)

2009-07-01

Grazing incidence small angle scattering with a 1 micron x-ray beam ({mu}GISAXS) is applied to study structural ordering of casein micelles and fibroin in solution cast films. {mu}GISAXS scans provide the possibility to locate highly ordered areas and to investigate variation in the molecular packing. In the case of the casein micelles, ordered film structures have been generated by decreasing their natural size dispersion. While dynamic light scattering was used to characterize the different size fractions in solution, {mu}GISAXS and roughness are measured on the resulting casein films. GISAXS-Patterns are analyzed by simulations providing the dimension and nearest neighbor distances of casein micelles. In the case of fibroin, ordering of nano-fibers formed during the drying process is investigated. The experimental data are analyzed by simulations and compared to SEM, AFM and Raman scattering experiments.

Grazing-incident PIXE Analysis Technology

International Nuclear Information System (INIS)

Li Hongri; Wang Guangpu; Liang Kun; Yang Ru; Han Dejun

2009-01-01

In the article, the grazing incidence technology is first applied to the PIXE (proton induced X-ray emission) analysis. Three pieces of samples were investigated, including the contaminated aluminium substrate, the SIMOX (separated by oxygen implantation) SOI (Silicon on Insulator) sample and the silicon wafer implanted with Fe + . The results reveal that the grazing-incident proton can improve the sensitivity of PIXE in trace analysis, especially for samples contaminated on surface. With the penetration depth of the proton bean decreased, the ratio of the peak area to the detection limit raised observably and the sensitivity near the sample surface increased. (authors)

Structural stability of naphthyl end-capped oligothiophenes in organic field-effect transistors measured by grazing-incidence X-ray diffraction in operando

DEFF Research Database (Denmark)

Huss-Hansen, Mathias K.; Lauritzen, Andreas E.; Bikondoa, Oier

2017-01-01

We report on microstructural durability of 5,5′-bis(naphth-2-yl)-2,2′-bithiophene (NaT2) in organic field-effect transistors (OFETs) in operando monitored by grazing-incidence X-ray diffraction (GIXRD). NaT2 maintains its monoclinic bulk motif in operating OFETs with a=20.31±0.06 Å, b=6.00±0.01 Å...

In situ x-ray reflectivity and grazing incidence x-ray diffraction study of L 1{sub 0} ordering in {sup 57}Fe/Pt multilayers

Energy Technology Data Exchange (ETDEWEB)

Raghavendra Reddy, V; Gupta, Ajay; Gome, Anil [UGC-DAE Consortium for Scientific Research, University Campus, Khandwa Road, Indore-452 017 (India); Leitenberger, Wolfram [Institute of Physics, University of Potsdam, 14469 Potsdam (Germany); Pietsch, U [Physics Department, University of Siegen, D-57068 Siegen (Germany)], E-mail: vrreddy@csr.ernet.in, E-mail: varimalla@yahoo.com

2009-05-06

In situ high temperature x-ray reflectivity and grazing incidence x-ray diffraction measurements in the energy dispersive mode are used to study the ordered face-centered tetragonal (fct) L 1{sub 0} phase formation in [Fe(19 A)/Pt(25 A)]{sub x 10} multilayers prepared by ion beam sputtering. With the in situ x-ray measurements it is observed that (i) the multilayer structure first transforms to a disordered FePt and subsequently to an ordered fct L 1{sub 0} phase, (ii) the ordered fct L 1{sub 0} FePt peaks start to appear at 320 deg. C annealing, (iii) the activation energy of the interdiffusion is 0.8 eV and (iv) ordered fct FePt grains have preferential out-of-plane texture. The magneto-optical Kerr effect and conversion electron Moessbauer spectroscopies are used to study the magnetic properties of the as-deposited and 400 deg. C annealed multilayers. The magnetic data for the 400 {sup 0}C annealed sample indicate that the magnetization is at an angle of {approx}50 deg. from the plane of the film.

Active Full-Shell Grazing-Incidence Optics

Science.gov (United States)

Davis, Jacqueline M.; Elsner, Ronald F.; Ramsey, Brian D.; O'Dell, Stephen L.; Kolodziejczak, Jeffery; Weisskopf, Martin C.; Gubarev, Mikhail V.

2016-01-01

MSFC has a long history of developing full-shell grazing-incidence x-ray optics for both narrow (pointed) and wide field (surveying) applications. The concept presented in this paper shows the potential to use active optics to switch between narrow and wide-field geometries, while maintaining large effective area and high angular resolution. In addition, active optics has the potential to reduce errors due to mounting and manufacturing lightweight optics. The design presented corrects low spatial frequency error and has significantly fewer actuators than other concepts presented thus far in the field of active x-ray optics. Using a finite element model, influence functions are calculated using active components on a full-shell grazing-incidence optic. Next, the ability of the active optic to effect a change of optical prescription and to correct for errors due to manufacturing and mounting is modeled.

Molecular aggregation states of poly{2-(perfluorooctyl)ethyl acrylate} polymer brush thin film analyzed by grazing incidence X-ray diffraction

International Nuclear Information System (INIS)

Yamaguchi, H; Honda, K; Takahara, A; Kobayashi, M; Morita, M; Masunaga, H; Sasaki, S; Takata, M; Sakata, O

2009-01-01

Fluoropolymer brush with crystalline side chains was prepared by surface-initiated atom transfer radical polymerization of 2-(perfluorooctyl)ethyl acrylate (FA-C 8 ) from a flat silicon substrate. The crystallization and the molecular aggregation structures of polymer side chain at the outermost surface and internal region in the brush film were characterized by grazing incidence X-ray diffraction (GIXD) measurement using two different incident angles of X-ray. At the air interface of PFA-C 8 brush film, the rod-like R f group was oriented perpendicular to the surface forming a hexagonal packing structure to reduce surface energy. In contrast, the oriented R f groups parallel to the substrate coexisted at the internal region in the brush. This unique depth dependence of crystalline state of the fluoropolymer brush was observed by surface-sensitive GIXD measurement.

The current status of grazing incidence optics

International Nuclear Information System (INIS)

Aschenbach, B.

1983-01-01

The developments in the area of grazing incidence optics with emphasis on telescopes for use in X-ray astronomy are reviewed. The performance of existing high-resolution telescopes is outlined and compared with those expected from future missions like ROSAT and AXAF. Starting from the basic principles of X-ray reflection and scattering, an attempt is made to highlight the current understanding of X-ray mirror physics using new theoretical ideas as well as experimental laboratory results. (author)

Depth distribution of chemical phase concentration determined by grazing incidence X-ray diffraction

International Nuclear Information System (INIS)

Novak, P.; Ballo, P.; Dobrocka, E.; Vallo, M.; Lalinsky, T.

2013-01-01

Grazing incidence geometry is widely used in X-ray diffraction analysis of thin films. Penetration depth of radiation can be easily changed by an appropriate selection of the angle of incidence α that enables obtaining information from different depths of the sample. This depth can be decreased up to a nanometer scale by approaching the critical angle α_c for total external reflection. This method therefore provides an efficient tool for the analysis of depth distribution of various structural properties, such as the crystallite size, the amorphous fraction, stress or the concentration of chemical phase. However, absorption of the radiation can be characterized by an average attenuation coefficient μ a special care has to be paid to the last property. Variation of chemical phase concentration with depth usually results in depth dependence on the attenuation coefficient. In this contribution a method for determination of depth distribution of a chemical phase is outlined. The method correctly takes into account the depth variation of the attenuation coefficient. The method is tested on thin oxidized Ir layers. The aim of this paper is a comparison two simple model cases with the experimental results. (authors)

The epitaxial growth and interfacial strain study of VO{sub 2}/MgF{sub 2} (001) films by synchrotron based grazing incidence X-ray diffraction

Energy Technology Data Exchange (ETDEWEB)

Fan, L.L. [Key Laboratory for Advanced Technology in Environmental Protection of Jiangsu Province, Yancheng Institute of Technology, Yancheng 224051 (China); National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029 (China); Chen, S. [National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029 (China); Liu, Q.H. [Science and Technology on Electro-optical Information Security Control Laboratory, Tianjin 300300 (China); Liao, G.M.; Chen, Y.L.; Ren, H. [National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029 (China); Zou, C.W., E-mail: czou@ustc.edu.cn [National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029 (China)

2016-09-05

High quality VO{sub 2} films with different thickness were epitaxially grown on MgF{sub 2} (001) substrates by oxide molecular beam epitaxy method. The evolution of interfacial strain was investigated by synchrotron based grazing incidence X-ray diffraction. By adjusting the incidence angles, the penetration depth of X-ray in VO{sub 2} film could be controlled and the thickness-depend lattice distortion in the epitaxial VO{sub 2} film was investigated. Due to the lattice mismatching, the pronounced tensile strain was observed in ultra-thin VO{sub 2} film. As the film thickness increasing, the interfacial strain relaxed gradually and became fully relaxed for thick VO{sub 2} films. Combined with the electric transport measurement, it was revealed that the phase transition temperature of ultra-thin VO{sub 2} film decreased greatly. The effect of interfacial strain induced phase transition modulation and the intrinsic mechanism was systematically discussed. - Highlights: • We prepared high quality VO{sub 2} epitaxial films on MgF{sub 2} (001) substrates by oxide molecular beam epitaxy method. • Synchrotron radiation grazing incidence X-ray diffraction was employed to detect evolution of strain along depth profile. • Based on a classic band structure model, the mechanism of strain controlled phase transition of VO{sub 2} was discussed.

Effect of Ar9+ irradiation on Zr-1Nb-1Sn-0.1Fe alloy characterized by Grazing Incidence X-ray diffraction technique

Science.gov (United States)

Dutta, Argha; Das, Kalipada; Gayathri, N.; Menon, Ranjini; Nabhiraj, P. Y.; Mukherjee, Paramita

2018-03-01

The microstructural parameters such as domain size and microstrain have been estimated from Grazing Incidence X-ray Diffraction (GIXRD) data for Ar9+ irradiated Zr-1Nb-1Sn-0.1Fe sample as a function of dpa (dose). Detail studies using X-ray Diffraction Line Profile Analysis (XRDLPA) from GIXRD data has been carried out to characterize the microstructural parameters like domain size and microstrain. The reorientation of the grains due to effect of irradiation at high dpa (dose) has been qualitatively assessed by the texture parameter P(hkl).

In situ grazing incidence small-angle X-ray scattering investigation of polystyrene nanoparticle spray deposition onto silicon.

Science.gov (United States)

Herzog, Gerd; Benecke, Gunthard; Buffet, Adeline; Heidmann, Berit; Perlich, Jan; Risch, Johannes F H; Santoro, Gonzalo; Schwartzkopf, Matthias; Yu, Shun; Wurth, Wilfried; Roth, Stephan V

2013-09-10

We investigated the spray deposition and subsequent self-assembly during drying of a polystyrene nanoparticle dispersion with in situ grazing incidence small-angle X-ray scattering at high time resolution. During the fast deposition of the dispersion and the subsequent evaporation of the solvent, different transient stages of nanoparticle assembly can be identified. In the first stage, the solvent starts to evaporate without ordering of the nanoparticles. During the second stage, large-scale structures imposed by the breakup of the liquid film are observable. In this stage, the solvent evaporates further and nanoparticle ordering starts. In the late third drying stage, the nanoparticles self-assemble into the final layer structure.

Grazing incidence x-ray diffraction analysis of zeolite NaA membranes on porous alumina tubes.

Science.gov (United States)

Kyotani, Tomohiro

2006-07-01

Zeolite NaA-type membranes hydrothermally synthesized on porous alumina tubes, for dehydration process, were characterized by grazing incidence 2 theta scan X-ray diffraction analysis (GIXRD). The fine structure of the membrane was studied fractionally for surface layer and for materials embedded in the porous alumina tube. The thickness of the surface layer on the porous alumina tube in the membranes used in this study was approximately 2-3 microm as determined from transmission electron microscopy with focused ion beam thin-layer specimen preparation technique (FIB-TEM). To discuss the effects of the membrane surface morphology on the GIXRD measurements, CaA-type membrane prepared by ion exchange from the NaA-type membrane and surface-damaged NaA-type membrane prepared by water leaching were also studied. For the original NaA-type membrane, 2 theta scan GIXRD patterns could be clearly measured at X-ray incidence angles (alpha) ranging from 0.1 to 2.0 deg in increments of 0.1 deg. The surface layers of the 2 - 3 microm on the porous alumina tube correspond to the alpha values up to ca. 0.2 deg. For the CaA-type and the surface-damaged NaA-type membranes, however, diffraction patterns from the surface layer could not be successfully detected and the others were somewhat broad. For all the three samples, diffraction intensities of both zeolite and alumina increased with depth (X-ray incidence angle, alpha) in the porous alumina tube region. The depth profile analysis of the membranes based on the GIXRD first revealed that amount of zeolite crystal embedded in the porous alumina tube is much larger than that in the surface layer. Thus, the 2 theta scan GIXRD is a useful method to study zeolite crystal growth mechanism around (both inside and outside) the porous alumina support during hydrothermal synthesis and to study water permeation behavior in the dehydration process.

X-ray diffraction study of surface-layer structure in parallel grazing rays

International Nuclear Information System (INIS)

Shtypulyak, N.I.; Yakimov, I.I.; Litvintsev, V.V.

1989-01-01

An x-ray diffraction method is described for study of thin polycrystalline and amorphous films and surface layers in an extremely asymmetrical diffraction system in parallel grazing rays using a DRON-3.0 diffractometer. The minimum grazing angles correspond to diffraction under conditions of total external reflection and a layer depth of ∼ 2.5-8 nm

Computer-Controlled Cylindrical Polishing Process for Development of Grazing Incidence Optics for Hard X-Ray Region

Science.gov (United States)

Khan, Gufran Sayeed; Gubarev, Mikhail; Speegle, Chet; Ramsey, Brian

2010-01-01

The presentation includes grazing incidence X-ray optics, motivation and challenges, mid spatial frequency generation in cylindrical polishing, design considerations for polishing lap, simulation studies and experimental results, future scope, and summary. Topics include current status of replication optics technology, cylindrical polishing process using large size polishing lap, non-conformance of polishin lap to the optics, development of software and polishing machine, deterministic prediction of polishing, polishing experiment under optimum conditions, and polishing experiment based on known error profile. Future plans include determination of non-uniformity in the polishing lap compliance, development of a polishing sequence based on a known error profile of the specimen, software for generating a mandrel polishing sequence, design an development of a flexible polishing lap, and computer controlled localized polishing process.

X-ray microscopy using grazing-incidence reflections optics

International Nuclear Information System (INIS)

Price, R.H.

1983-01-01

The role of Kirkpatrick-Baez microscopes as the workhorse of the x-ray imaging devices is discussed. This role is being extended with the development of a 22X magnification Kirkpatrick-Baez x-ray microscope with multilayer x-ray mirrors. These mirrors can operate at large angles, high x-ray energies, and have a narrow, well defined x-ray energy bandpass. This will make them useful for numerous experiments. However, where a large solid angle is needed, the Woelter microscope will still be necessary and the technology needed to build them will be useful for many other types of x-ray optics

Crystallization behavior of polyethylene on silicon wafers in solution casting processes traced by time-resolved measurements of synchrotron grazing-incidence small-angle and wide-angle X-ray scattering

International Nuclear Information System (INIS)

Sasaki, S; Masunaga, H; Takata, M; Itou, K; Tashiro, K; Okuda, H; Takahara, A

2009-01-01

Crystallization behavior of polyethylene (PE) on silicon wafers in solution casting processes has been successfully traced by time-resolved grazing-incidence small-angle and wide-angle X-ray scattering (GISWAXS) measurements utilizing synchrotron radiation. A p-xylene solution of PE kept at ca. 343 K was dropped on a silicon wafer at ca. 298 K. While the p-xylene evaporated naturally from the dropped solution sample, PE chains crystallized to be a thin film. Raman spectral measurements were performed simultaneously with the GISWAXS measurements to evaluate quantitatively the p-xylene the dropped solution contained. Grazing-incidence wide-angle X-ray scattering (GIWAXS) patterns indicated nucleation and crystal growth in the dropped solution and the following as-cast film. GIWAXS and Raman spectral data revealed that crystallization of PE was enhanced after complete evaporation of the p-xylene from the dropped solution. The [110] and [200] directions of the orthorhombic PE crystal became relatively parallel to the wafer surface with time, which implied that the flat-on lamellae with respect to the wafer surface were mainly formed in the as-cast film. On the other hand, grazing-incidence small-angle X-ray scattering (GISAXS) patterns implied formation of isolated lamellae in the dropped solution. The lamellae and amorphous might alternatively be stacked in the preferred direction perpendicular to the wafer surface. The synchrotron GISWAXS experimental method could be applied for kinetic study on hierarchical structure of polymer thin films.

Grazing incidence X-ray diffraction study of the tilted phases of Langmuir films: Determination of molecular conformations using simulated annealing

International Nuclear Information System (INIS)

Pignat, J.; Daillant, J.; Cantin, S.; Perrot, F.; Konovalov, O.

2007-01-01

We have analyzed grazing incidence X-ray diffraction (GIXD) data from condensed phases of Langmuir films of long-chain fatty acids at the air-water using a new method consisting in a careful extraction of the structure factors followed by fitting of molecular parameters using simulated annealing. We show that the information contained in GIXD spectra is enough to obtain near-atomic structural information. In particular, we directly determine the orientation of the chain backbone planes and of the carboxylic headgroups, and we evaluate chain conformation defects

Grazing incidence X-ray diffraction study of the tilted phases of Langmuir films: Determination of molecular conformations using simulated annealing

Energy Technology Data Exchange (ETDEWEB)

Pignat, J. [LIONS/Service de Chimie Moleculaire, CEA-Saclay bat. 125, F-91191 Gif-sur-Yvette Cedex (France); LPPI, universite de Cergy-Pontoise, 5 mail Gay-Lussac Neuville/Oise, 95031 Cergy-Pontoise Cedex (France); Daillant, J. [LIONS/Service de Chimie Moleculaire, CEA-Saclay bat. 125, F-91191 Gif-sur-Yvette Cedex (France)]. E-mail: jean.daillant@cea.fr; Cantin, S. [LPPI, universite de Cergy-Pontoise, 5 mail Gay-Lussac Neuville/Oise, 95031 Cergy-Pontoise Cedex (France); Perrot, F. [LPPI, universite de Cergy-Pontoise, 5 mail Gay-Lussac Neuville/Oise, 95031 Cergy-Pontoise Cedex (France); Konovalov, O. [ESRF, 6 rue Jules Horowitz, BP220, 38043 Grenoble Cedex (France)

2007-05-23

We have analyzed grazing incidence X-ray diffraction (GIXD) data from condensed phases of Langmuir films of long-chain fatty acids at the air-water using a new method consisting in a careful extraction of the structure factors followed by fitting of molecular parameters using simulated annealing. We show that the information contained in GIXD spectra is enough to obtain near-atomic structural information. In particular, we directly determine the orientation of the chain backbone planes and of the carboxylic headgroups, and we evaluate chain conformation defects.

X-ray microscopy using grazing-incidence reflection optics

International Nuclear Information System (INIS)

Price, R.H.

1981-01-01

The Kirkpatrick-Baez microscopes are described along with their role as the workhorse of the x-ray imaging devices. This role is being extended with the development of a 22X magnification Kirkpatrick-Baez x-ray microscope with multilayer x-ray mirrors. These mirrors can operate at large angles, high x-ray energies, and have a narrow, well defined x-ray energy bandpass. This will make them useful for numerous experiments. However, where a large solid angle is needed, the Woelter microscope will still be necessary and the technology needed to build them will be useful for many other types of x-ray optics

Metrology and Alignment of Light Weight Grazing Incidence X-Ray Mirrors

Science.gov (United States)

Zhang, William; Content, David; Petre, Robert; Saha, Timo

2000-01-01

Metrology and alignment of light weight X-ray optics have been a challenge for two reasons: (1) that the intrinsic mirror quality and distortions caused by handling can not be easily separated, and (2) the diffraction limits of the visible light become a severe problem at the order of one arc-minute. Traditional methods of using a normal incident pencil or small parallel beam which monitors a tiny fraction of the mirror in question at a given time can not adequately monitor those distortions. We are developing a normal incidence setup that monitors a large fraction, if not the whole, of the mirror at any given time. It will allow us to align thin X-ray mirrors to-an accuracy of a few arc seconds or to a limit dominated by the mirror intrinsic quality.

Crystalline self-assembly of organic molecules with metal ions at the air-aqueous solution interface. A grazing incidence X-ray scattering study

DEFF Research Database (Denmark)

Weissbuch, I.; Buller, R.; Kjær, K.

2002-01-01

The advent of intense X-rays from synchrotron sources made possible to probe, at the molecular level, the structural aspects of self-assemblies generated at interfaces. Here we present the two-dimensional (2-D) packing arrangements of two-, three- and multi-component organo-metallic self......-assemblies formed via interfacial reaction at the air-aqueous solution interface, as determined by grazing incidence X-ray diffraction (GIRD) and X-ray specular reflectivity techniques. GIXD yields structural information on the crystalline part of the Langmuir film, including the ions and counterions lateral order...... of metal ions bound to the polar head groups of amphipilic molecules; use of bolaamphiphiles to generate oriented thin films with metal ions arranged in periodic layers; delineation of differences in the lateral organization of metal ions at interfaces as induced by racemates and enantiomerically pure...

A flow cell for transient voltammetry and in situ grazing incidence X-ray diffraction characterization of electrocrystallized cadmium(II) tetracyanoquinodimethane

Energy Technology Data Exchange (ETDEWEB)

Veder, Jean-Pierre [Nanochemistry Research Institute, Department of Chemistry, Curtin University, GPO Box U1987, Perth, Western Australia 6845 (Australia); Nafady, Ayman [School of Chemistry, Monash University, Clayton, Victoria 3800 (Australia); Clarke, Graeme [Nanochemistry Research Institute, Department of Chemistry, Curtin University, GPO Box U1987, Perth, Western Australia 6845 (Australia); Williams, Ross P. [Centre for Materials Research, Department of Imaging and Applied Physics, Curtin University, GPO Box U1987, Perth, Western Australia 6845 (Australia); De Marco, Roland, E-mail: r.demarco@curtin.edu.a [Nanochemistry Research Institute, Department of Chemistry, Curtin University, GPO Box U1987, Perth, Western Australia 6845 (Australia); Bond, Alan M. [School of Chemistry, Monash University, Clayton, Victoria 3800 (Australia)

2011-01-01

An easy to fabricate and versatile cell that can be used with a variety of electrochemical techniques, also meeting the stringent requirement for undertaking cyclic voltammetry under transient conditions in in situ electrocrystallization studies and total external reflection X-ray analysis, has been developed. Application is demonstrated through an in situ synchrotron radiation-grazing incidence X-ray diffraction (SR-GIXRD) characterization of electrocrystallized cadmium (II)-tetracyanoquinodimethane material, Cd(TCNQ){sub 2}, from acetonitrile (0.1 mol dm{sup -3} [NBu{sub 4}][PF{sub 6}]). Importantly, this versatile cell design makes SR-GIXRD suitable for almost any combination of total external reflection X-ray analysis (e.g., GIXRF and GIXRD) and electrochemical perturbation, also allowing its application in acidic, basic, aqueous, non-aqueous, low and high flow pressure conditions. Nevertheless, the cell design separates the functions of transient voltammetry and SR-GIXRD measurements, viz., voltammetry is performed at high flow rates with a substantially distended window to minimize the IR (Ohmic) drop of the electrolyte, while SR-GIXRD is undertaken using stop-flow conditions with a very thin layer of electrolyte to minimize X-ray absorption and scattering by the solution.

Discrimination and quantification of implanted solar wind in Genesis collector shards using grazing incidence synchrotron x-ray techniques: New detector initial results

International Nuclear Information System (INIS)

Kitts, K.; Choi, Y.; Sutton, S.R.; Ghose, S.; Burnett, D.; Eng, P.

2008-01-01

Accurate knowledge of the composition of the Sun provides a baseline, which allows an understanding of how the solar system has evolved over time and how solar processes and solar wind mechanics behave. Unfortunately, the errors in photospheric abundances are too large for many planetary science problems and this hampers our understanding of these different processes. Analyses of solar wind implanted in meteorites or lunar soils have provided more precise data [e.g. 1 and references therein] but the extent to which alteration processes on these bodies complicate such information is only now being determined. Therefore, in order to obtain pristine solar wind samples, NASA developed and launched the Genesis Discovery Mission. Unfortunately, the probe crash-landed shattering the 300 collector plates into 15,000+ pieces complicating the analysis and necessitating the development of new analytical techniques and equipment. Thus, shards from the Genesis collector array and their appropriate flight spares are currently being characterized via grazing-incidence synchrotron x-ray techniques at the Advanced Photon Source at Argonne National Laboratory. The goals are (1) determine solar wind fluences of the elements Ca-Ge by grazing-incidence angle-resolved x-ray fluorescence (XRF) and x-ray reflectivity, (2) improve data reduction via the development of XRF spectral deconvolution routines and develop modeling algorithms for reflectivity and fluorescence yield analysis in order to determine element specific depth profiles from which absolute concentration may be extracted and (3) designing and developing a new multi-element silicon multi-channel (SMCD) detector system. These improvements will increase our sensitivity by a factor of three or more, reduce measurement time at a given sensitivity to one-eighth and the minimum detection limit would be reduced by a factor of 3 to ∼3 x 10 8 atoms/cm 2 .

Molecular aggregation states of poly{l_brace}2-(perfluorooctyl)ethyl acrylate{r_brace} polymer brush thin film analyzed by grazing incidence X-ray diffraction

Energy Technology Data Exchange (ETDEWEB)

Yamaguchi, H; Honda, K; Takahara, A [Graduate School of Engineering, Kyushu University, Nishi-ku, Fukuoka 819-0395 (Japan); Kobayashi, M [Institute for Materials Chemistry and Engineering, Kyushu University, 744 Motooka, Nishi-ku, Fukuoka 819-0395 (Japan); Morita, M [Fundamental Research Department, Chemical Division, Daikin Industries, Ltd., 1-1 Nishi Hitotsuya, Settsu-shi, Osaka 566-8585 (Japan); Masunaga, H; Sasaki, S; Takata, M [Japan Synchrotron Research Institute, Mikazuki Sayo, Hyogo 671-5198 (Japan); Sakata, O, E-mail: takahara@cstf.kyushu-u.ac.j [RIKEN Harima Institute, Mikazuki Sayo, Hyogo 671-5198 (Japan)

2009-08-01

Fluoropolymer brush with crystalline side chains was prepared by surface-initiated atom transfer radical polymerization of 2-(perfluorooctyl)ethyl acrylate (FA-C{sub 8}) from a flat silicon substrate. The crystallization and the molecular aggregation structures of polymer side chain at the outermost surface and internal region in the brush film were characterized by grazing incidence X-ray diffraction (GIXD) measurement using two different incident angles of X-ray. At the air interface of PFA-C{sub 8} brush film, the rod-like R{sub f} group was oriented perpendicular to the surface forming a hexagonal packing structure to reduce surface energy. In contrast, the oriented R{sub f} groups parallel to the substrate coexisted at the internal region in the brush. This unique depth dependence of crystalline state of the fluoropolymer brush was observed by surface-sensitive GIXD measurement.

Grazing angle X-ray fluorescence from periodic structures on silicon and silica surfaces

International Nuclear Information System (INIS)

Nowak, S.H.; Banaś, D.; Błchucki, W.; Cao, W.; Dousse, J.-Cl.; Hönicke, P.; Hoszowska, J.; Jabłoński, Ł.; Kayser, Y.; Kubala-Kukuś, A.; Pajek, M.; Reinhardt, F.; Savu, A.V.; Szlachetko, J.

2014-01-01

Various 3-dimensional nano-scaled periodic structures with different configurations and periods deposited on the surface of silicon and silica substrates were investigated by means of the grazing incidence and grazing emission X-ray fluorescence techniques. Apart from the characteristics which are typical for particle- and layer-like samples, the measured angular intensity profiles show additional periodicity-related features. The latter could be explained by a novel theoretical approach based on simple geometrical optics (GO) considerations. The new GO-based calculations were found to yield results in good agreement with experiment, also in cases where other theoretical approaches are not valid, e.g., periodic particle distributions with an increased surface coverage

Structure of Co-Doped Alq3 thin films investigated by grazing incidence X-ray absorption fine structure and Fourier transform infrared spectroscopy.

Science.gov (United States)

Lin, Liang; Pang, Zhiyong; Fang, Shaojie; Wang, Fenggong; Song, Shumei; Huang, Yuying; Wei, Xiangjun; Yu, Haisheng; Han, Shenghao

2011-02-10

The structural properties of Co-doped tris(8-hydroxyquinoline)aluminum (Alq(3)) have been studied by grazing incidence X-ray absorption fine structure (GIXAFS) and Fourier transform infrared spectroscopy (FTIR). GIXAFS analysis suggests that there are multivalent Co-Alq(3) complexes and the doped Co atoms tend to locate at the attraction center with respect to N and O atoms and bond with them. The FTIR spectra indicate that the Co atoms interact with the meridional (mer) isomer of Alq(3) rather than forming inorganic compounds.

Structure of a monolayer of molecular rotors on aqueous subphase from grazing-incidence X-ray diffraction.

Science.gov (United States)

Kaleta, Jiří; Wen, Jin; Magnera, Thomas F; Dron, Paul I; Zhu, Chenhui; Michl, Josef

2018-03-23

In situ grazing-incidence X-ray scattering shows that a monolayer of artificial rod-shaped dipolar molecular rotors produced on the surface of an aqueous subphase in a Langmuir trough has a structure conducive to a 2D ferroelectric phase. The axes of the rotors stand an average of 0.83 nm apart in a triangular grid, perpendicular to the surface within experimental error. They carry 2,3-dichlorophenylene rotators near rod centers, between two decks of interlocked triptycenes installed axially on the rotor axle. The analysis is based first on simultaneous fitting of observed Bragg rods and second on fitting the reflectivity curve with only three adjustable parameters and the calculated rotor electron density, which also revealed the presence of about seven molecules of water near each rotator. Dependent on preparation conditions, a minor and variable amount of a different crystal phase may also be present in the monolayer.

A Grazing-Incidence Small-Angle X-Ray Scattering View of Vertically Aligned ZnO Nano wires

International Nuclear Information System (INIS)

Lavcevic, M.L.; Silovic, L.; Dubcek, P.; Pavlovic, M.; Bernstorff, S.

2013-01-01

We report a grazing-incidence small-angle X-ray scattering study of ZnO films with vertically aligned and randomly distributed nano wires, grown through a hydrothermal growth process on nano structured ZnO seeding coatings and deposited by electron beam evaporation on silicon and glass, respectively. The comparison of the scattering patterns of seeding coatings and nano wires showed that the scattering of vertically aligned nano wires exhibited a specific feature: the dominant characteristic of their scattering patterns is the appearance of fine structure effects around the specular peak. These effects were clarified by the combined reflection and scattering phenomena, suggested for the aligned nano wires-substrate system. Furthermore, they enabled the calculation of the average gyration radius of nano wires in horizontal direction. The calculated value was in good agreement with the radii of nano wires estimated by surface electron microscopy. Therefore, the observed feature in the scattering pattern can serve as evidence of the aligned growth of nano wires.

Discrimination and quantification of contamination and implanted solar wind in Genesis collector shards using grazing incidence synchrotron x-ray techniques: Initial results

International Nuclear Information System (INIS)

Kitts, K.; Sutton, S.; Eng, P.; Ghose, S.; Burnett, D.

2006-01-01

Grazing incidence X-ray fluorescence is a non-destructive technique that can differentiate the embedded solar wind component from surface contamination and collector background in the Genesis shards. Initial solar Fe abundance in D30554 is 8 x 10 12 /cm 2 . Accurate knowledge of the composition of the Sun provides a baseline, which allows an understanding of how the solar system has evolved over time and how solar processes and solar wind mechanics behave. Unfortunately, the errors in photospheric abundances are too large for many planetary science problems and this hampers our understanding of these different processes. Analyses of solar wind implanted in meteorites or lunar soils have provided more precise data but alteration processes on these bodies may complicate such information. In response to this need for pristine solar wind samples, NASA developed and launched the Genesis Probe. Unfortunately, the probe smashed into the Utah desert shattering the 300 collector plates into 15,000+ pieces all of which are now coated in a both a fine terrestrial dust and Si and Ge powder from the disrupted collectors themselves. The solar wind penetration depth is 100-200 nm and the superposed contamination layers are typically 40-50 nm. Stringent cleaning regimes have the potential of removing the solar wind itself. The best solution is to have sufficient spatial resolution to separately analyze the surface contamination and penetrated solar wind. To that end, three Genesis collector array shards and their appropriate flight spares were characterized via grazing incidence x-ray fluorescence and x-ray reflectivity. The goals were (1) to evaluate the various cleaning methods used to eliminate contamination, (2) to identify the collector substrates most suited for this technique, (3) to determine whether the solar wind signature could be deconvolved from the collector background signature, and (4) to measure the relative abundances of Ca to Ge in the embedded solar wind.

Phase and Texture of Solution-Processed Copper Phthalocyanine Thin Films Investigated by Two-Dimensional Grazing Incidence X-Ray Diffraction

Directory of Open Access Journals (Sweden)

Lulu Deng

2011-07-01

Full Text Available The phase and texture of a newly developed solution-processed copper phthalocyanine (CuPc thin film have been investigated by two-dimensional grazing incidence X-ray diffraction. The results show that it has β phase crystalline structure, with crystallinity greater than 80%. The average size of the crystallites is found to be about 24 nm. There are two different arrangements of crystallites, with one dominating the diffraction pattern. Both of them have preferred orientation along the thin film normal. Based on the similarities to the vacuum deposited CuPc thin films, the new solution processing method is verified to offer a good alternative to vacuum process, for the fabrication of low cost small molecule based organic photovoltaics.

X-Ray Optics at NASA Marshall Space Flight Center

Science.gov (United States)

O'Dell, Stephen L.; Atkins, Carolyn; Broadway, David M.; Elsner, Ronald F.; Gaskin, Jessica A.; Gubarev, Mikhail V.; Kilaru, Kiranmayee; Kolodziejczak, Jeffery J.; Ramsey, Brian D.; Roche, Jacqueline M.;

Development and applications of grazing exit micro X-ray fluorescence instrument using a polycapillary X-ray lens

International Nuclear Information System (INIS)

Emoto, T.; Sato, Y.; Konishi, Y.; Ding, X.; Tsuji, K.

2004-01-01

A polycapillary X-ray lens is an effective optics to obtain a μm-size X-ray beam for micro-X-ray fluorescence spectrometry (μ-XRF). We developed a μ-XRF instrument using a polycapillary X-ray lens, which also enabled us to perform Grazing Exit μ-XRF (GE-μ-XRF). The evaluated diameter of the primary X-ray beam was 48 μm at the focal distance of the X-ray lens. Use of this instrument enabled two-dimensional mapping of the elemental distributions during growth of the plant 'Quinoa'. The results of the mapping revealed elemental transition during growth. In addition, a small region of thin film was analyzed by GE-μ-XRF. We expect that GE-μ-XRF will become an effective method of estimating the film thickness of a small region

Impact of Lipid Oxidization on Vertical Structures and Electrostatics of Phospholipid Monolayers Revealed by Combination of Specular X-ray Reflectivity and Grazing-Incidence X-ray Fluorescence.

Science.gov (United States)

Korytowski, Agatha; Abuillan, Wasim; Makky, Ali; Konovalov, Oleg; Tanaka, Motomu

2015-07-30

The influence of phospholipid oxidization of floating monolayers on the structure perpendicular to the global plane and on the density profiles of ions near the lipid monolayer has been investigated by a combination of grazing incidence X-ray fluorescence (GIXF) and specular X-ray reflectivity (XRR). Systematic variation of the composition of the floating monolayers unravels changes in the thickness, roughness and electron density of the lipid monolayers as a function of molar fraction of oxidized phospholipids. Simultaneous GIXF measurements enable one to qualitatively determine the element-specific density profiles of monovalent (K(+) or Cs(+)) and divalent ions (Ca(2+)) in the vicinity of the interface in the presence and absence of two types of oxidized phospholipids (PazePC and PoxnoPC) with high spatial accuracy (±5 Å). We found the condensation of Ca(2+) near carboxylated PazePC was more pronounced compared to PoxnoPC with an aldehyde group. In contrast, the condensation of monovalent ions could hardly be detected even for pure oxidized phospholipid monolayers. Moreover, pure phospholipid monolayers exhibited almost no ion specific condensation near the interface. The quantitative studies with well-defined floating monolayers revealed how the elevation of lipid oxidization level alters the structures and functions of cell membranes.

Surface morphology and in-plane-epitaxy of SmBa2Cu3O7-δ films on SrTiO3 (001) substrates studied by STM and grazing incidence x-ray diffraction

DEFF Research Database (Denmark)

Jiang, Q.D.; Smilgies, D.M.; Feidenhans'l, R.

1996-01-01

The surface morphology and in-plane epitaxy of thin films of SmBa(2)Cu3O(7-delta) (Sm-BCO) grown on SrTiO3 (001) substrates with various thicknesses have been investigated by scanning tunneling microscopy (STM) and grazing incidence x-ray diffraction (GIXRD). As revealed by GIXRD, SmBCO films as ...... films above h(c2), introduction of screw dislocations leads to spiral growth.......The surface morphology and in-plane epitaxy of thin films of SmBa(2)Cu3O(7-delta) (Sm-BCO) grown on SrTiO3 (001) substrates with various thicknesses have been investigated by scanning tunneling microscopy (STM) and grazing incidence x-ray diffraction (GIXRD). As revealed by GIXRD, SmBCO films...... substrate. Three different types of surface morphology were observed by STM with increasing film thickness h: a) 2D growth for hh(c2). With GIXRD, a density modulation is observed in the films with a thickness below h(c2). For thicker...

Test facility for astronomical x-ray optics

DEFF Research Database (Denmark)

Christensen, Finn Erland; Lewis, Robert A.; Bordas, J.

1990-01-01

Grazing incidence x-ray optics for x-ray astronomical applications are used outside the earth's atmosphere. These devices require a large collection aperture and the imaging of an x-ray source that is essentially placed at infinity. The ideal testing system for these optical elements has to appro......Grazing incidence x-ray optics for x-ray astronomical applications are used outside the earth's atmosphere. These devices require a large collection aperture and the imaging of an x-ray source that is essentially placed at infinity. The ideal testing system for these optical elements has...... to approximate that encountered under working conditions; however, the testing of these optical elements is notoriously difficult with conventional x-ray generators. Synchrotron radiation (SR) sources are sufficiently brilliant to produce a nearly perfect parallel beam over a large area while still retaining...... a flux considerably higher than that available from conventional x-ray generators. A facility designed for the testing of x-ray optics, particularly in connection with x-ray telescopes, is described. It is proposed that this facility will be accommodated at the Synchrotron Radiation Source...

Development and applications of grazing exit micro X-ray fluorescence instrument using a polycapillary X-ray lens

Energy Technology Data Exchange (ETDEWEB)

Emoto, T.; Sato, Y.; Konishi, Y.; Ding, X.; Tsuji, K. E-mail: tsuji@a-chem.eng.osaka-cu.ac.jp

2004-08-31

A polycapillary X-ray lens is an effective optics to obtain a {mu}m-size X-ray beam for micro-X-ray fluorescence spectrometry ({mu}-XRF). We developed a {mu}-XRF instrument using a polycapillary X-ray lens, which also enabled us to perform Grazing Exit {mu}-XRF (GE-{mu}-XRF). The evaluated diameter of the primary X-ray beam was 48 {mu}m at the focal distance of the X-ray lens. Use of this instrument enabled two-dimensional mapping of the elemental distributions during growth of the plant 'Quinoa'. The results of the mapping revealed elemental transition during growth. In addition, a small region of thin film was analyzed by GE-{mu}-XRF. We expect that GE-{mu}-XRF will become an effective method of estimating the film thickness of a small region.

Evaluation of Poisson's ratio and Young's modulus of nitride films by combining grazing incidence X-ray diffraction and laser curvature techniques

International Nuclear Information System (INIS)

Chen, H.-Y.; Chen, J.-H.; Lu, F.-H.

2007-01-01

Measurements of Poisson's ratio and the Young's modulus of thin films have been problematic. In this work, evaluation of both Poisson's ratio and Young's modulus is conducted using grazing incidence X-ray diffraction combined with measurement of the induced stress. Poisson's ratio was evaluated from analysis of the X-ray diffraction data to obtain a strain-cos 2 α.sin 2 ψ plot. Moreover, the Young's modulus of the films could be also calculated from that plot as well as from the residual stress, which could be determined by a measurement of stress induced substrate curvature. The ternary nitride TiAlN is used as a model system for the evaluation. The films, prepared by cathodic arc plasma deposition, exhibited a strong (111) preferred orientation and a composition corresponding to Ti 0.6 Al 0.4 N. The measured Poisson's ratio and the Young's modulus of the films were 0.143 ± 0.003 and 310 ± 20 GPa, respectively, which are comparable to those reported in the literature

Grazing incidence Fe-line telescopes using W/B4C multilayers

DEFF Research Database (Denmark)

Joensen, K. D.; Gorenstein, P.; Christensen, Finn Erland

1995-01-01

The loss of throughput observed at higher energies for traditional grazing-incidence X-ray telescopes coated with high-Z elements can be partly countered by employing multilayers on the outermost reflectors. Using 8-keV reflectivity data from a periodic W/B4C multilayer, the expected performance...

Trends in grazing emission x-ray analysis techniques

International Nuclear Information System (INIS)

Grieken, R. van; Tsuji, K.; Injuk, J.

2000-01-01

In grazing-emission x-ray fluorescence (GEXRF) spectrometry, XRF is made surface-sensitive, not by grazing incidence of the exciting radiation as in total reflection XRF (TXRF), but by detecting only that part of fluorescence radiation that is emitted at grazing angles above a polished sample carrier or above a flat wafer. In case of GEXRF, and contrary to TXRF, wavelength-dispersive (WD) detection can be used. Applications are, in principle, similar to those of (variable angle) TXRF. At the laboratory scale, only prototype instruments are available, and the GEXRF unit can be an accessory to a commercial WD-XRF instrument. The detection limits of GEXRF are in the higher pg range, corresponding to a concentration of between 0.4-3 μg/l, if a sample volume of 100 μl is examined. Because of the WD detection, GEXRF also lends itself for the analysis of low-Z elements, from Z > 5; this is an advantage over conventional TXRF (but similar to TXRF using a thin-window energy-dispersive detector). Since the GEXRF prototype is a sequential rather than a simultaneous instrument, the analysis time is long when many elements have to be determined. Moreover, because the soft characteristic radiation is more strongly absorbed in its longer path through the matrix than in TXRF, the linear response for trace analysis using GEXRF is limited; this was proven by calculating the fluorescence intensities as a function of layer thickness and composition. The specimens are very limited in thickness. The sample preparation procedure for liquid or other samples to be analyzed with the GEXRF unit is thus very problematic. Results for water samples, bio-materials and pigment and aerosol samples have indeed shown that the quantitative nature of GEXRF for trace analysis is poor. The most promising features of GEXRF are in the field of surface and thin-layer analysis. Trace contaminations on silicon wafers can be determined and depth profiling can characterize stratified near-surface layers. But

Some simple ideas on x-ray reflection and grazing-incidence diffraction from thin surfactant films

DEFF Research Database (Denmark)

Kjær, K.

1994-01-01

For Langmuir films of long linear amphiphilic molecules at the air-water interface, grazing-incidence diffraction data resolved in terms of both the horizontal and vertical components of the scattering angle can be evaluated to a fair level of detail by means of a slide rule. Specular reflection ...... data require more sophisticated means although some rules of thumb can be formulated.......For Langmuir films of long linear amphiphilic molecules at the air-water interface, grazing-incidence diffraction data resolved in terms of both the horizontal and vertical components of the scattering angle can be evaluated to a fair level of detail by means of a slide rule. Specular reflection...

A customizable software for fast reduction and analysis of large X-ray scattering data sets: applications of the new DPDAK package to small-angle X-ray scattering and grazing-incidence small-angle X-ray scattering.

Science.gov (United States)

Benecke, Gunthard; Wagermaier, Wolfgang; Li, Chenghao; Schwartzkopf, Matthias; Flucke, Gero; Hoerth, Rebecca; Zizak, Ivo; Burghammer, Manfred; Metwalli, Ezzeldin; Müller-Buschbaum, Peter; Trebbin, Martin; Förster, Stephan; Paris, Oskar; Roth, Stephan V; Fratzl, Peter

2014-10-01

X-ray scattering experiments at synchrotron sources are characterized by large and constantly increasing amounts of data. The great number of files generated during a synchrotron experiment is often a limiting factor in the analysis of the data, since appropriate software is rarely available to perform fast and tailored data processing. Furthermore, it is often necessary to perform online data reduction and analysis during the experiment in order to interactively optimize experimental design. This article presents an open-source software package developed to process large amounts of data from synchrotron scattering experiments. These data reduction processes involve calibration and correction of raw data, one- or two-dimensional integration, as well as fitting and further analysis of the data, including the extraction of certain parameters. The software, DPDAK (directly programmable data analysis kit), is based on a plug-in structure and allows individual extension in accordance with the requirements of the user. The article demonstrates the use of DPDAK for on- and offline analysis of scanning small-angle X-ray scattering (SAXS) data on biological samples and microfluidic systems, as well as for a comprehensive analysis of grazing-incidence SAXS data. In addition to a comparison with existing software packages, the structure of DPDAK and the possibilities and limitations are discussed.

Constellation-X to Generation-X: evolution of large collecting area moderate resolution grazing incidence x-ray telescopes to larger area high-resolution adjustable optics

Science.gov (United States)

Reid, Paul B.; Cameron, Robert A.; Cohen, Lester; Elvis, Martin; Gorenstein, Paul; Jerius, Diab; Petre, Robert; Podgorski, William A.; Schwartz, Daniel A.; Zhang, William W.

2004-10-01

Large collecting area x-ray telescopes are designed to study the early Universe, trace the evolution of black holes, stars and galaxies, study the chemical evolution of the Universe, and study matter in extreme environments. The Constellation-X mission (Con-X), planned for launch in 2016, will provide ~ 10^4 cm^2 collecting area with 15 arc-sec resolution, with a goal of 5 arc-sec. Future missions require larger collecting area and finer resolution. Generation-X (Gen-X), a NASA Visions Mission, will achieve 100 m^2 effective area at 1 keV and angular resolution of 0.1 arc-sec, half power diameter. We briefly describe the Con-X flowdown of imaging requirements to reflector figure error. To meet requirements beyond Con-X, Gen-X optics will be thinner and more accurately shaped than has ever been accomplished. To meet these challenging goals, we incorporate for the first time active figure control with grazing incidence optics. Piezoelectric material will be deposited in discrete cells directly on the back surface of the optical segments, with the strain directions oriented parallel to the surface. Differential strain between the two layers of the mirror causes localized bending in two directions, enabling local figure control. Adjusting figure on-orbit eases fabrication and metrology. The ability to make changes to mirror figure adds margin by mitigating risk due to launch-induced deformations and/or on-orbit degradation. We flowdown the Gen-X requirements to mirror figure and four telescope designs, and discuss various trades between the designs.

Hard X-ray Optics Technology Development for Astronomy at the Marshall Space Flight Center

Science.gov (United States)

Gubarev, Mikhail; Ramsey, Brian; Kilaru, Kiranmayee

2009-01-01

Grazing-incidence telescopes based on Wolter 1 geometry have delivered impressive advances in astrophysics at soft-x-ray wavelengths, while the hard xray region remains relatively unexplored at fine angular resolution and high sensitivities. The ability to perform ground-breaking science in the hard-x-ray energy range had been the motivation for technology developments aimed at fabricating low-cost, light-weight, high-quality x-ray mirrors. Grazing-incidence x-ray optics for high-energy astrophysical applications is being developed at MSFC using the electroform-nickel replication process.

Measurement of UO2 surface oxidation using grazing-incidence x-ray diffraction: Implications for nuclear forensics

Science.gov (United States)

Tracy, Cameron L.; Chen, Chien-Hung; Park, Sulgiye; Davisson, M. Lee; Ewing, Rodney C.

2018-04-01

Nuclear forensics involves determination of the origin and history of interdicted nuclear materials based on the detection of signatures associated with their production and trafficking. The surface oxidation undergone by UO2 when exposed to air is a potential signature of its atmospheric exposure during handling and transport. To assess the sensitivity of this oxidation to atmospheric parameters, surface sensitive grazing-incidence x-ray diffraction (GIXRD) measurements were performed on UO2 samples exposed to air of varying relative humidity (34%, 56%, and 95% RH) and temperature (room temperature, 50 °C, and 100 °C). Near-surface unit cell contraction was observed following exposure, indicating oxidation of the surface and accompanying reduction of the uranium cation ionic radii. The extent of unit cell contraction provides a measure of the extent of oxidation, allowing for comparison of the effects of various exposure conditions. No clear influence of relative humidity on the extent of oxidation was observed, with samples exhibiting similar degrees of unit cell contraction at all relative humidities investigated. In contrast, the thickness of the oxidized layers increased substantially with increasing temperature, such that differences on the order of 10 °C yielded readily observable crystallographic signatures of the exposure conditions.

Opto-mechanical Analyses for Performance Optimization of Lightweight Grazing-incidence Mirrors

Science.gov (United States)

Roche, Jacqueline M.; Kolodziejczak, Jeffery J.; Odell, Stephen L.; Elsner, Ronald F.; Weisskopf, Martin C.; Ramsey, Brian; Gubarev, Mikhail V.

2013-01-01

New technology in grazing-incidence mirror fabrication and assembly is necessary to achieve subarcsecond optics for large-area x-ray telescopes. In order to define specifications, an understanding of performance sensitivity to design parameters is crucial. MSFC is undertaking a systematic study to specify a mounting approach, mirror substrate, and testing method. Lightweight mirrors are typically flimsy and are, therefore, susceptible to significant distortion due to mounting and gravitational forces. Material properties of the mirror substrate along with its dimensions significantly affect the distortions caused by mounting and gravity. A parametric study of these properties and their relationship to mounting and testing schemes will indicate specifications for the design of the next generation of lightweight grazing-incidence mirrors. Here we report initial results of this study.

Study of the grazing-incidence X-ray scattering of strongly disturbed fractal surfaces

Energy Technology Data Exchange (ETDEWEB)

Roshchin, B. S., E-mail: ross@crys.ras.ru; Chukhovsky, F. N.; Pavlyuk, M. D.; Opolchentsev, A. M.; Asadchikov, V. E. [Russian Academy of Sciences, Shubnikov Institute of Crystallography, Federal Research Centre “Crystallography and Photonics” (Russian Federation)

2017-03-15

The applicability of different approaches to the description of hard X-ray scattering from rough surfaces is generally limited by a maximum surface roughness height of no more than 1 nm. Meanwhile, this value is several times larger for the surfaces of different materials subjected to treatment, especially in the initial treatment stages. To control the roughness parameters in all stages of surface treatment, a new approach has been developed, which is based on a series expansion of wavefield over the plane eigenstate-function waves describing the small-angle scattering of incident X-rays in terms of plane q-waves propagating through the interface between two media with a random function of relief heights. To determine the amplitudes of reflected and transmitted plane q-waves, a system of two linked integral equations was derived. The solutions to these equations correspond (in zero order) to the well-known Fresnel expressions for a smooth plane interface. Based on these solutions, a statistical fractal model of an isotropic rough interface is built in terms of root-mean-square roughness σ, two-point correlation length l, and fractal surface index h. The model is used to interpret X-ray scattering data for polished surfaces of single-crystal cadmium telluride samples.

Active Micro structured Optical Arrays of Grazing Incidence Reflectors

International Nuclear Information System (INIS)

Willingale, R.; Feldman, Ch.; Michette, A.; Hart, D.; McFaul, Ch; Morrison, G.R.; Pfauntsch, S.; Powell, A.K.; Sahraei, Sh.; Shand, M.T.; Button, T.; Rodriguez-Sanmartin, D.; Zhang, D.; Dunare, C.; Parkes, W.; Stevenson, T.; Folkard, M.; Vojnovic, B.; Vojnovic, B.

2011-01-01

The UK Smart X-Ray Optics (SXO) programme is developing active/adaptive optics for terrestrial applications. One of the technologies proposed is micro structured optical arrays (MOAs), which focus X-rays using grazing incidence reflection through consecutive aligned arrays of microscopic channels. Although such arrays are similar in concept to poly capillary and microchannel plate optics, they can be bent and adjusted using piezoelectric actuators providing control over the focusing and inherent aberrations. Custom configurations can be designed, using ray tracing and finite element analysis, for applications from sub-keV to several-keV X-rays, and the channels of appropriate aspect ratios can be made using deep silicon etching. An exemplar application will be in the micro probing of biological cells and tissue samples using Ti Ka radiation (4.5?keV) in studies related to radiation-induced cancers. This paper discusses the optical design, modelling, and manufacture of such optics

Grazing incidence synchrotron X-ray diffraction of marbles consolidated with diammonium hydrogen phosphate treatments: non-destructive probing of buried minerals

Science.gov (United States)

Possenti, Elena; Colombo, Chiara; Conti, Claudia; Gigli, Lara; Merlini, Marco; Plaisier, Jasper Rikkert; Realini, Marco; Gatta, G. Diego

2018-05-01

Diammonium hydrogen phosphate (DAP)-based consolidating treatments react with carbonatic stones and form calcium phosphates phases, whose composition depends on the availability of free calcium ions. In this work, an innovative non-destructive approach based on grazing incidence X-ray diffraction (GIXRD) with synchrotron radiation (SR) is used to investigate DAP-treated Carrara marble specimens and to study the influence of the substrate composition on the crystallization of calcium phosphate phases. The outcomes indicate that the presence of compositional micro-heterogeneity of Carrara marble favours the formation of specific phases. Dicalcium phosphate dihydrate, a calcium phosphate with a low Ca/P molar ratio, is formed on carbonatic phases with a low Ca amount, such as dolomite grains and Mg-containing veins. Furthermore, this study highlights the potentialities of SR-GIXRD as a powerful non-destructive tool for the diagnostic of Cultural Heritage objects since it allows investigating the conservation history of stone materials and their interaction with the environment.

Note: Comparison of grazing incidence small angle x-ray scattering of a titania sponge structure at the beamlines BW4 (DORIS III) and P03 (PETRA III)

International Nuclear Information System (INIS)

Rawolle, M.; Körstgens, V.; Ruderer, M. A.; Metwalli, E.; Guo, S.; Müller-Buschbaum, P.; Herzog, G.; Benecke, G.; Schwartzkopf, M.; Buffet, A.; Perlich, J.; Roth, S. V.

2012-01-01

Grazing incidence small angle x-ray scattering (GISAXS) is a powerful technique for morphology investigation of nanostructured thin films. GISAXS measurements at the newly installed P03 beamline at the storage ring PETRA III in Hamburg, Germany, are compared to the GISAXS data from the beamline BW4 at the storage ring DORIS III, which had been used extensively for GISAXS investigations in the past. As an example, a titania thin film sponge structure is investigated. Compared to BW4, at beamline P03 the resolution of larger structures is slightly improved and a higher incident flux leads to a factor of 750 in scattered intensity. Therefore, the acquisition time in GISAXS geometry is reduced significantly at beamline P03.

Studies on strain relaxation of La{sub 0.5}Ba{sub 0.5}MnO{sub 3} film by normal and grazing incidence X-ray diffraction

Energy Technology Data Exchange (ETDEWEB)

Wang, Haiou [Hangzhou Dianzi University, Institute of Materials Physics, Hangzhou (China); Tan, Weishi [Hunan City University, College of Communication and Electronic Engineering, Yiyang (China); Nanjing University of Science and Technology, Key Laboratory of Soft Chemistry and Functional Materials, Department of Applied Physics, Ministry of Education, Nanjing (China); Liu, Hao [Suzhou Institute of Industrial Technology, Department of Electronic and Communication Engineering, Suzhou (China); Cao, Mengxiong; Wang, Xingyu; Ma, Chunlin [Nanjing University of Science and Technology, Key Laboratory of Soft Chemistry and Functional Materials, Department of Applied Physics, Ministry of Education, Nanjing (China); Jia, Quanjie [The Chinese Academy of Sciences, Institute of High Energy Physics, Beijing (China)

2017-03-15

Perovskite manganite La{sub 0.5}Ba{sub 0.5}MnO{sub 3} (LBMO) films were deposited on (001)-oriented single-crystal SrTiO{sub 3} (STO) substrates by pulsed laser deposition. High-resolution X-ray diffraction and grazing incidence X-ray diffraction techniques were applied to characterize the crystal structure and lattice strain of LBMO films. The in-plane and out-of-plane growth orientations of LBMO films with respect to substrate surface have been studied. The epitaxial orientation relationship LBMO (001) [100] //STO (001) [100] exists at the LBMO/STO interface. The lattice strain of LBMO film begins to relax with the thickness of LBMO film up to 12 nm. When the thickness is further increased up to 43 nm, the film is in fully strain-relaxed state. Jahn-Teller strain plays an important role in LBMO/STO system. The mechanism for strain relaxation is in accordance with that of tetragonal distortion. (orig.)

An in situ grazing incidence x-ray scattering study of block copolymer thin films during solvent vapor annealing

Science.gov (United States)

Gu, Xiaodan; Gunkel, Ilja; Hexemer, Alexander; Russell, Thomas

2014-03-01

Although solvent vapor annealing (SVA) has been widely applied to block copolymer (BCP) thin films to obtain well-ordered microdomains, the mechanism of enhancing lateral order is not well understood. Here, we used real time in situ grazing-incidence small-angle x-ray scattering (in situGISAXS) to study the self-assembly of PS-b-P2VP BCP BCPs with different molecular weights thin films in THF vapor, a near neutral solvent for both blocks. Both swelling and deswelling behavior of BCP thin films were examined. The extent of swellingand the solvent removal rate not only affect the domain spacing of BCPs but also dictate the extent of lateral ordering of the BCP microdomains. Larger grains were observed at higher values of the swelling ratio (close to disordering). To preserve the maximal lateral ordering of the microdomains in the swollen state, the fastest solvent removal rate is required to freeze in the ordered microdomain structure of the swollen BCP film. We thanks support from U.S. Department of Energy BES under contract BES-DE-FG02-96ER45612 and ALS doctoral fellowship.

Crystal and electronic structures of pentacene thin films from grazing-incidence x-ray diffraction and first-principles calculations

International Nuclear Information System (INIS)

Nabok, Dmitrii; Puschnig, Peter; Ambrosch-Draxl, Claudia; Werzer, Oliver; Resel, Roland; Smilgies, Detlef-M.

2007-01-01

Combined experimental and theoretical investigations on thin films of pentacene are performed in order to determine the structure of the pentacene thin film phase. Grazing incidence x-ray diffraction is used for studying a pentacene thin film with a nominal thickness of 180 nm. The crystal structure is found to exhibit the lattice parameters a=0.592 nm, b=0.754 nm, c=1.563 nm, α=81.5 deg. , β=87.2 deg. , and γ=89.9 deg. . These crystallographic unit cell dimensions are used as the only input parameters for ab initio total-energy calculations within the framework of density functional theory revealing the molecular packing within the crystal structure. Moreover, we calculate the electronic band structure of the thin film phase and compare it to that of the bulk phase. We find the intermolecular bandwidths of the thin film phase to be significantly larger compared to the bulk structure, e.g., the valence bandwidth is twice as large. This remarkable effect is traced back to an enhanced intermolecular π-π overlap due to the upright standing molecules in the thin film phase

Grazing Incidence Wavefront Sensing and Verification of X-Ray Optics Performance

Science.gov (United States)

Saha, Timo T.; Rohrbach, Scott; Zhang, William W.

2011-01-01

Evaluation of interferometrically measured mirror metrology data and characterization of a telescope wavefront can be powerful tools in understanding of image characteristics of an x-ray optical system. In the development of soft x-ray telescope for the International X-Ray Observatory (IXO), we have developed new approaches to support the telescope development process. Interferometrically measuring the optical components over all relevant spatial frequencies can be used to evaluate and predict the performance of an x-ray telescope. Typically, the mirrors are measured using a mount that minimizes the mount and gravity induced errors. In the assembly and mounting process the shape of the mirror segments can dramatically change. We have developed wavefront sensing techniques suitable for the x-ray optical components to aid us in the characterization and evaluation of these changes. Hartmann sensing of a telescope and its components is a simple method that can be used to evaluate low order mirror surface errors and alignment errors. Phase retrieval techniques can also be used to assess and estimate the low order axial errors of the primary and secondary mirror segments. In this paper we describe the mathematical foundation of our Hartmann and phase retrieval sensing techniques. We show how these techniques can be used in the evaluation and performance prediction process of x-ray telescopes.

A compact soft x-ray (0.1–1.2 keV) calibration bench for radiometric measurements using an original versatile Rowland circle grazing incidence monochromator

Energy Technology Data Exchange (ETDEWEB)

Hubert, S., E-mail: sebastien.hubert@cea.fr

2017-05-21

This paper describes an original Rowland circle grazing incidence spectrometer used as a monochromator for a soft x-ray Manson source in order to calibrate both the source and detectors over the 0.1–1.2 keV spectral range. The originality of the instrument lies on a patented vacuum manipulator which allows the simultaneous boarding of two detectors, one (reference) for measuring the monochromatic radiation and the second to be calibrated. In order to achieve this, the vacuum manipulator is able to interchange, in vacuum, one detector with the other in front of the exit slit of the monochromatizing stage. One purpose of this apparatus was to completely eliminate the intrinsic bremsstrahlung emission of the x-ray diode source and isolate each characteristic line for quantitative detector calibrations. Obtained spectral resolution (Δλ/λ<10{sup −2}) and spectral purity (>98%) fully meet this objective. Initially dimensioned to perform calibration of bulky x-ray cameras unfolded on the Laser MégaJoule Facility, other kinds of detector can be obviously calibrated using this instrument. A brief presentation of the first calibration of an x-ray CCD through its quantum efficiency (QE) measurement is included in this paper as example. Comparison with theoretical model for QE and previous measurements at higher energy are finally presented and discussed.

Reflection of attosecond x-ray free electron laser pulses

International Nuclear Information System (INIS)

Hau-Riege, Stefan P.; Chapman, Henry N.

2007-01-01

In order to utilize hard x-ray free electron lasers (XFEL's) when they are extended to attosecond pulse lengths, it is necessary to choose optical elements with minimal response time. Specular grazing-incidence optics made of low-Z materials are popular candidates for reflectors since they are likely to withstand x-ray damage and provide sufficiently large reflectivities. Using linear-optics reflection theory, we calculated the transient reflectivity of a delta-function electric pulse from a homogenous semi-infinite medium as a function of angle of incidence for s- and p-polarized light. We specifically considered the pulse response of beryllium, diamond, silicon carbide, and silicon, all of which are of relevance to the XFEL's that are currently being built. We found that the media emit energy in a damped oscillatory way, and that the impulse-response times are shorter than 0.3 fs for normal incidence. For grazing incidence, the impulse-response time is substantially shorter, making grazing-incidence mirrors a good choice for deep subfemtosecond reflective optics

Characterization of ion-beam mixed multilayers via grazing x-ray reflectometry

International Nuclear Information System (INIS)

Le Boite, M.G.; Traverse, A.; Nevot, L.; Pardo, B.; Corno, J.

1988-01-01

The grazing x-ray reflectrometry technique was used as a way to study modifications in metallic multilayers induced by ion-beam irradiation. Due to the high sensitivity of the technique, short-range atomic displacements of an atom A in a layer B can be detected so that the first stages of ion-beam mixing can be investigated. The rate of mixing is measured and the compound A/sub 1-//sub x/B/sub x/ formed at the layers' interfaces is characterized

X-ray metrology for ULSI structures

International Nuclear Information System (INIS)

Bowen, D. K.; Matney, K. M.; Wormington, M.

1998-01-01

Non-destructive X-ray metrological methods are discussed for application to both process development and process control of ULSI structures. X-ray methods can (a) detect the unacceptable levels of internal defects generated by RTA processes in large wafers, (b) accurately measure the thickness and roughness of layers between 1 and 1000 nm thick and (c) can monitor parameters such as crystallographic texture and the roughness of buried interfaces. In this paper we review transmission X-ray topography, thin film texture measurement, grazing-incidence X-ray reflectivity and high-resolution X-ray diffraction. We discuss in particular their suitability as on-line sensors for process control

Surface characterization of selected polymer thin films by total-reflection x-ray fluorescence spectroscopy and x-ray reflectivity

International Nuclear Information System (INIS)

Innis, Vallerie Ann A.

2006-01-01

Development of available x-ray characterizations tools for grazing incidence techniques was done to be able to probe nano-size thin films. Alignment of a Philips x-ray powder diffractometer was improved to let it perform as an x-ray reflectometer. X-ray reflectometry was coupled with total-reflection x-ray fluorescence spectroscopy. Evaluation of the performance of this grazing incidence techniques was done by preparing polymer thin films of carboxymethylcellulose, carrageenan and polyvinylpyrrolidone (PVP). The thickness of the films were varied by varying the process parameters such as concentration, spin speed and spin time. Angle-dispersive total-reflection x-ray fluorescence spectroscopy profiles of three films showed film formation only in carrageenan and PVP. For both carrageenan and PVP, an increase in concentration yielded a corresponding increase in intensity of the fluorescent or scattered peaks. XRR profiles of carrageenan thin films yielded a mean value for the critical angle close to quartz substrate. Thickness measurements of the prepared carrageenan thin films showed that concentration was the main determinant for final film thickness over the other process parameters. Sulfur fluorescent intensity derived from the TXRF measurement showed a linear relationship with the measured thickness by XRR. For PVP, measured critical angle is lower than quartz. Poor adhesion of the polymer onto the substrate yielded a limited number of thickness measurements made from the XRR profiles. (Author)

Design of a normal incidence multilayer imaging X-ray microscope

Science.gov (United States)

Shealy, David L.; Gabardi, David R.; Hoover, Richard B.; Walker, Arthur B. C., Jr.; Lindblom, Joakim F.

Normal incidence multilayer Cassegrain X-ray telescopes were flown on the Stanford/MSFC Rocket X-ray Spectroheliograph. These instruments produced high spatial resolution images of the sun and conclusively demonstrated that doubly reflecting multilayer X-ray optical systems are feasible. The images indicated that aplanatic imaging soft X-ray/EUV microscopes should be achievable using multilayer optics technology. A doubly reflecting normal incidence multilayer imaging X-ray microscope based on the Schwarzschild configuration has been designed. The design of the microscope and the results of the optical system ray trace analysis are discussed. High resolution aplanatic imaging X-ray microscopes using normal incidence multilayer X-ray mirrors should have many important applications in advanced X-ray astronomical instrumentation, X-ray lithography, biological, biomedical, metallurgical, and laser fusion research.

Development of a portable system of grazing exit X-Ray fluorescence applied to environmental and biological studies

Energy Technology Data Exchange (ETDEWEB)

Santos, Ramon S.; Oliveira, Davi F.; Anjos, Marcelino J. [Universidade do Estado do Rio de Janeiro (UERJ), RJ (Brazil). Instituto de Fisica; Assis, Joaquim T., E-mail: ramonziosp@yahoo.com.br, E-mail: davi.oliveira@uerj.br, E-mail: marcelin@uerj.br, E-mail: joaquim.iprj@gmail.com [Universidade do Estado do Rio de Janeiro (UERJ), Nova Friburgo, RJ (Brazil). Instituto Politécnico

2017-07-01

In this study was developed a portable system of grazing exit X-ray fluorescence (geometric 90° - 0°) that will be applied in environmental studies (aerosol samples) and biological studies. GE-XRF portable system is formed by a mini X-ray tube of low power (anode of Au, maximum voltage and current of 50 kV and 200 μA, respectively) and a SiPIN detector (model XR-100CR of the Amptek). The reflectors used as sample support (sampler carrier) were quartz discs with 25.4 mm diameter and 3.0 mm thickness. The grazing exit angle was experimentally determined by measuring a cooper solution (10 μg.g{sup -1}). The system of GE-XRF proved to be quite stable and reproducible. It was calculated the sensibility curve of the system using multielement solutions. The accuracy of the system was checked using multielement reference solution as standard reference material. The relative errors between measured and certified values are in the range of 4 to 19%. The first results showed a background was drastically reduced at grazing exit angles, enabling trace elemental analysis. This paper shows that it is possible to produce a portable system of grazing exit X-ray fluorescence compact, efficient, low-cost and easy-to-handle instrumentation using a low-power X-ray tube and a SiPIN compact detector. (author)

Theoretical concepts of X-ray nanoscale analysis theory and applications

CERN Document Server

Benediktovitch, Andrei; Ulyanenkov, Alexander

2013-01-01

This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data ana

Study of interface correlation in W/C multilayer structure by specular and non-specular grazing incidence X-ray reflectivity measurements

Energy Technology Data Exchange (ETDEWEB)

Biswas, A., E-mail: arupb@barc.gov.in; Bhattacharyya, D.; Sahoo, N. K. [Atomic and Molecular Physics Division, Bhabha Atomic Research Centre, Mumbai 400085 (India); Maidul Haque, S.; Tripathi, S.; De, Rajnarayan [Atomic and Molecular Physics Division, Bhabha Atomic Research Centre, VIZAG Centre, Visakhapatnam 530012 (India); Rai, S. [Indus Synchrotron Utilization Division, Raja Raman Centre for Advanced Technology, Indore 452013 (India)

2015-10-28

W/C/W tri-layer thin film samples have been deposited on c-Si substrates in a home-built Ion Beam Sputtering system at 1.5 × 10{sup −3} Torr Ar working pressure and 10 mA grid current. The tri-layer samples have been deposited at different Ar{sup +} ion energies between 0.6 and 1.2 keV for W layer deposition and the samples have been characterized by specular and non-specular grazing incidence X-ray reflectivity (GIXR) measurements. By analyzing the GIXR spectra, various interface parameters have been obtained for both W-on-C and C-on-W interfaces and optimum Ar{sup +} ion energy for obtaining interfaces with low imperfections has been found. Subsequently, multilayer W/C samples with 5-layer, 7-layer, 9-layer, and 13-layer have been deposited at this optimum Ar{sup +} ion energy. By fitting the specular and diffused GIXR data of the multilayer samples with the parameters of each interface as fitting variables, different interface parameters, viz., interface width, in-plane correlation length, interface roughness, and interface diffusion have been estimated for each interface and their variation across the depth of the multilayers have been obtained. The information would be useful in realizing W/C multilayers for soft X-ray mirror application in the <100 Å wavelength regime. The applicability of the “restart of the growth at the interface” model in the case of these ion beam sputter deposited W/C multilayers has also been investigated in the course of this study.

Simultaneous analysis of Grazing Incidence X-Ray reflectivity and X-ray standing waves from periodic multilayer systems

NARCIS (Netherlands)

Yakunin, S.N.; Makhotkin, Igor Alexandrovich; Chuyev, M.A.; Seregin, A.Y.; Pashayev, E.M.; Louis, Eric; van de Kruijs, Robbert Wilhelmus Elisabeth; Bijkerk, Frederik; Kovalchuk, M.V.

2012-01-01

Structural analysis of periodic multilayers with small period thickness (~4 nm) is a challenging task, especially when thicknesses of intermixed interfaces become comparable to individual layer thicknesses. In general, angular dependent X-ray fluorescence measurements, excited by the X-ray standing

Strain, size and composition of InAs quantum sticks, embedded in InP, determined via X-ray anomalous diffraction and diffraction anomalous fine structure in grazing incidence

International Nuclear Information System (INIS)

Letoublon, A.; Favre-Nicolin, V.; Renevier, H.; Proietti, M.G.; Monat, C.; Gendry, M.; Marty, O.; Priester, C.

2005-01-01

We report on the study of strain, size and composition of small-size encapsulated semiconductor nanostructures. We show that the partial structure factor of As atoms in InAs stick-like nanostructures (quantum sticks), embedded in InP, can be directly extracted from grazing incidence anomalous X-ray diffraction maps at the As K-edge. We have recovered the average height and strain of the islands and determined their composition. The average height of the quantum sticks (QSs), as deduced from the width of the structure factor profile is 2.54 nm. The InAs out of plane deformation, relative to InP, is equal to 6.1%. Fixed-Q anomalous diffraction spectra, measured at the As K-edge, in grazing incidence provide clear evidence of pure InAs QSs. This is confirmed by the analysis of the diffraction anomalous fine structure (DAFS) that also gives a direct way to recover the strain accomodation inside the quantum sticks. Finite difference method calculations reproduce well the diffraction data. Chemical mixing at interfaces is at most 1 ML. This paper shows that ultimate application of anomalous diffraction and DAFS together with reciprocal space maps is a powerful method to sudy the structural properties of nanostructures

High-Resolution Detector for At-Wavelength Metrology of X-Ray Optics, Phase I

Data.gov (United States)

National Aeronautics and Space Administration — Since the launch of the first X-ray focusing telescope in 1963, the development of grazing incidence X-ray optics has been crucial to the development of the field of...

High-Resolution Detector for At-Wavelength Metrology of X-Ray Optics, Phase II

Data.gov (United States)

National Aeronautics and Space Administration — Since the launch of the first X-ray focusing telescope in 1963, the development of grazing incidence X-ray optics has been crucial to the development of the field of...

Si Nanoribbons on Ag(110) Studied by Grazing-Incidence X-Ray Diffraction, Scanning Tunneling Microscopy, and Density-Functional Theory: Evidence of a Pentamer Chain Structure.

Science.gov (United States)

Prévot, Geoffroy; Hogan, Conor; Leoni, Thomas; Bernard, Romain; Moyen, Eric; Masson, Laurence

2016-12-30

We report a combined grazing incidence x-ray diffraction (GIXD), scanning tunneling microscopy (STM), and density-functional theory (DFT) study which clearly elucidates the atomic structure of the Si nanoribbons grown on the missing-row reconstructed Ag(110) surface. Our study allows us to discriminate between the theoretical models published in the literature, including the most stable atomic configurations and those based on a missing-row reconstructed Ag(110) surface. GIXD measurements unambiguously validate the pentamer model grown on the reconstructed surface, obtained from DFT. This pentamer atomistic model accurately matches the high-resolution STM images of the Si nanoribbons adsorbed on Ag(110). Our study closes the long-debated atomic structure of the Si nanoribbons grown on Ag(110) and definitively excludes a honeycomb structure similar to that of freestanding silicene.

Fluence thresholds for grazing incidence hard x-ray mirrors

Czech Academy of Sciences Publication Activity Database

Aquila, A.; Sobierajski, R.; Ozkan, C.; Hájková, Věra; Burian, Tomáš; Chalupský, Jaromír; Juha, Libor; Störmer, M.; Bajt, S.; Klepka, M.T.; Dlužewski, P.; Morawiec, K.; Ohashi, H.; Koyama, T.; Tono, K.; Inubushi, Y.; Yabashi, M.; Sinn, H.; Tschentscher, T.; Mancuso, A.P.; Gaudin, J.

2015-01-01

Roč. 106, č. 24 (2015), "241905-1"-"241905-5" ISSN 0003-6951 R&D Projects: GA ČR(CZ) GA14-29772S Grant - others:AVČR(CZ) M100101221 Institutional support: RVO:68378271 Keywords : XFEL * Free Electron Laser * damage threshold * X-ray optics Subject RIV: BH - Optics , Masers, Lasers Impact factor: 3.142, year: 2015

Wolter type I x-ray focusing mirror using multilayer coatings

International Nuclear Information System (INIS)

Chon, Kwon Su; Namba, Yoshiharu; Yoon, Kwon-Ha

2006-01-01

A multilayer coating is a useful addition to a mirror in the x-ray region and has been applied to normal incidence mirrors used with soft x rays. When a multilayer coating is used on grazing incidence optics, higher performance can be achieved than without it.Cr/Sc multilayers coated on a Wolter type I mirror substrate for a soft x-ray microscope are considered. The reflectivity and effective solid angle are calculated for Wolter type I mirrors with uniform and laterally graded multilayer coatings. The laterally graded multilayer mirror showed superior x-ray performance, and the multilayer tolerances were relaxed. This multilayer mirror could be especially useful in the soft x-ray microscope intended for biological applications

Thin Film Structure of Tetraceno(2,3-B)thiophene Characterized By Grazing Incidence X-Ray Scattering And Near-Edge X-Ray Absorption Fine Structure Analysis

International Nuclear Information System (INIS)

Yuan, Q.; Mannsfeld, S.C.B.; Tang, M.L.; Toney, M.F.; Luening, J.; Bao, Z.A.

2008-01-01

Understanding the structure-property relationship for organic semiconductors is crucial in rational molecular design and organic thin film process control. Charge carrier transport in organic field-effect transistors predominantly occurs in a few semiconductor layers close to the interface in contact with the dielectric layer, and the transport properties depend sensitively on the precise molecular packing. Therefore, a better understanding of the impact of molecular packing and thin film morphology in the first few monolayers above the dielectric layer on charge transport is needed to improve the transistor performance. In this Article, we show that the detailed molecular packing in thin organic semiconductor films can be solved through a combination of grazing incidence X-ray diffraction (GIXD), near-edge X-ray absorption spectra fine structure (NEXAFS) spectroscopy, energy minimization packing calculations, and structure refinement of the diffraction data. We solve the thin film structure for 2 and 20 nm thick films of tetraceno(2,3-b)thiophene and detect only a single phase for these thicknesses. The GIXD yields accurate unit cell dimensions, while the precise molecular arrangement in the unit cell was found from the energy minimization and structure refinement; the NEXAFS yields a consistent molecular tilt. For the 20 nm film, the unit cell is triclinic with a = 5.96 A, b = 7.71 A, c = 15.16 A, alpha = 97.30 degrees, beta = 95.63 degrees, gamma = 90 degrees; there are two molecules per unit cell with herringbone packing (49-59 degree angle) and tilted about 7 degrees from the substrate normal. The thin film structure is significantly different from the bulk single-crystal structure, indicating the importance of characterizing thin film to correlate with thin film device performance. The results are compared to the corresponding data for the chemically similar and widely used pentacene. Possible effects of the observed thin film structure and morphology on

An Evaluation of Grazing-Incidence Optics for Neutron Imaging

Science.gov (United States)

Gubarev, M. V.

2007-01-01

The refractive index for most materials is slightly less than unity, which opens an opportunity to develop the grazing incidence neutron imaging optics. The ideal material for the optics would be natural nickel and its isotopes. Marshall Space Flight Center (MSFC) has active development program on the nickel replicated optics for use in x-ray astronomy. Brief status report on the program is presented. The results of the neutron focusing optic test carried by the MSFC team at National Institute of Standards and Technology (NIST) are also presented. Possible applications of the optics are briefly discussed.

Soft X-ray Focusing Telescope Aboard AstroSat: Design, Characteristics and Performance

DEFF Research Database (Denmark)

Singh, K; Stewart, G.; Westergaard, Niels Jørgen Stenfeldt

2017-01-01

The Soft X-ray focusing Telescope (SXT), India’s first X-ray telescope based on the principle of grazing incidence, was launched aboard the AstroSat and made operational on October 26, 2015. X-rays in the energy band of 0.3–8.0 keV are focussed on to a cooled charge coupled device thus providing ...

VETA-I x ray test analysis

Science.gov (United States)

Brissenden, R. J. V.; Chartas, G.; Freeman, M. D.; Hughes, J. P.; Kellogg, E. M.; Podgorski, W. A.; Schwartz, D. A.; Zhao, P.

1992-01-01

This interim report presents some definitive results from our analysis of the VETA-I x-ray testing data. It also provides a description of the hardware and software used in the conduct of the VETA-I x-ray test program performed at the MSFC x-ray Calibration Facility (XRCF). These test results also serve to supply data and information to include in the TRW final report required by DPD 692, DR XC04. To provide an authoritative compendium of results, we have taken nine papers as published in the SPIE Symposium, 'Grazing Incidence X-ray/EUV Optics for Astronomy and Projection Lithography' and have reproduced them as the content of this report.

Quantitative measurements with x-ray microscopes in laser-fusion experiments

International Nuclear Information System (INIS)

Marshall, F.J.; Su, Q.

1995-01-01

X-ray imaging of laser-fusion target implosions has been performed on the University of Rochester's OMEGA laser system by means of grazing-incidence optical imaging with Kirkpatrick--Baez (KB) microscopes. High spatial resolution imaging (∼5 μm) of hard x-ray emission (up to ∼7 keV) has been achieved. New grazing-incidence optics are currently being fabricated for the OMEGA Upgrade experimental laser-fusion facility. Projected performance indicates that resolution may be increased to ∼2 μm at the center of the field of view and sensitivity extended to ∼8 keV. Uses of KB microscopes on the OMEGA Upgrade will include hard x-ray imaging, grating-dispersed imaged spectroscopy, and framed imaging. A novel technique for monochromatic imaging with KB microscopes has also been demonstrated enabling images of target emission in a narrow energy band (10 to 20 eV) to be obtained

Spatial resolution in depth-controlled surface sensitive x-ray techniques

International Nuclear Information System (INIS)

Yun, W.B.; Viccaro, P.J.

1992-01-01

The spatial resolution along the surface normal and the total depth probed are two important parameters in depth-controlled surface sensitive X-ray techniques employing grazing incidence geometry. The two parameters are analyzed in terms of optical properties (refractive indices) of the media involved and parameters of the incident X-ray beam: beam divergence, X-ray energy, and spectral bandwidth. We derive analytical expressions of the required beam divergence and spectral bandwidth of the incident beam as a function of the two parameters. Sample calculations are made for X-ray energies between 0.1 and 100 keV and for solid Be, Cu, and Au, representing material matrices consisting of low, medium, and high atomic number elements. A brief discussion on obtaining the required beam divergence and spectral bandwidth from present X-ray sources and optics is given

Characteristics of X-ray photons in tilted incident laser-produced plasma

International Nuclear Information System (INIS)

Wang Ruirong; Chen Weimin; Xie Dongzhu

2008-01-01

Characteristics of X-ray and spout direction of heat plasma flow were studied on Shenguang-II laser facility. Using of pinhole X-ray camera, X-ray photons from the plasma of aluminum (Al) irradiated by 1.053 μm laser, was measured and analysed. It is observed that the spatial distribution of X-ray photons in Al plasma for tilted irradiation is symmetic at the center of the target. The spout direction of heat plasma flow is inferred by the distribution contour of X-ray photons. the experimental results show that the spout direction of heat plasma flow is normal to target plane and the output intensity of X-ray photons does not increase significantly for tilted laser incidence. Uniformity of laser energy deposition is improved by superposing tilted incident and laser perpendicularly incident laser. At the same time, it is found that the conversion efficiency from the tilted incident laser energy to X-ray photons of laser-produced plasma is decreased. (authors)

Design and Tests of the Hard X-ray Polarimeter X-Calibur

Directory of Open Access Journals (Sweden)

M. Beilicke

2014-12-01

Full Text Available X-ray polarimetry promises to give qualitatively new information bout high-energy astrophysical sources, such as binary black hole  systems, micro-quasars, active galactic nuclei, and gamma-ray bursts. We designed, built and tested ahard X-ray polarimeter, X-Calibur, to be used in the focal plane of the InFOCuS grazing incidence hard X-ray telescope.X-Calibur combines a low-Z Compton scatterer with a CZT detector assembly to measure the polarization of 20−60 keV X-rays making use of the fact that polarized photons Compton scatter preferentially perpendicular to the electric field orientation; in principal, a similar space-borne experiment could be operated in the 5−100 keV regime. X-Calibur achieves a high detection efficiency of order unity.

Transmission X-ray mirror

International Nuclear Information System (INIS)

Lairson, B.M.; Bilderback, D.H.

1982-01-01

Transmission X-ray mirrors have been made from 400 A to 10 000 A thick soap films and have been shown to have novel properties. Using grazing angles of incidence, low energy X-rays were reflected from the front surface while more energetic X-rays were transmitted through the mirror largely unattenuated. A wide bandpass monochromator was made from a silicon carbide mirror followed by a soap film transmission mirror and operated in the white beam at the cornell High Energy Synchrotron Source (CHESS). Bandpasses of ΔE/E=12% to 18% were achieved at 13 keV with peak efficiencies estimated to be between 55% and 75%, respectively. Several wide angle scattering photographs of stretched polyethylene and a phospholipid were obtained in 10 s using an 18% bandpass. (orig.)

Toward Adaptive X-Ray Telescopes

Science.gov (United States)

O'Dell, Stephen L.; Atkins, Carolyn; Button, Tim W.; Cotroneo, Vincenzo; Davis, William N.; Doel, Peer; Feldman, Charlotte H.; Freeman, Mark D.; Gubarev, Mikhail V.; Kolodziejczak, Jeffrey J.;

Laboratory-size three-dimensional x-ray microscope with Wolter type I mirror optics and an electron-impact water window x-ray source

Energy Technology Data Exchange (ETDEWEB)

Ohsuka, Shinji, E-mail: ohsuka@crl.hpk.co.jp [Hamamatsu Photonics K.K., 5000 Hirakuchi, Hamakita-ku, Hamamatsu-City, 434-8601 (Japan); The Graduate School for the Creation of New Photonics Industries, 1955-1 Kurematsu-cho, Nishi-ku, Hamamatsu-City, 431-1202 (Japan); Ohba, Akira; Onoda, Shinobu; Nakamoto, Katsuhiro [Hamamatsu Photonics K.K., 5000 Hirakuchi, Hamakita-ku, Hamamatsu-City, 434-8601 (Japan); Nakano, Tomoyasu [Hamamatsu Photonics K.K., 5000 Hirakuchi, Hamakita-ku, Hamamatsu-City, 434-8601 (Japan); Ray-Focus Co. Ltd., 6009 Shinpara, Hamakita-ku, Hamamatsu-City, 434-0003 (Japan); Miyoshi, Motosuke; Soda, Keita; Hamakubo, Takao [Research Center for Advanced Science and Technology, The University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8904 (Japan)

2014-09-15

We constructed a laboratory-size three-dimensional water window x-ray microscope that combines wide-field transmission x-ray microscopy with tomographic reconstruction techniques, and observed bio-medical samples to evaluate its applicability to life science research fields. It consists of a condenser and an objective grazing incidence Wolter type I mirror, an electron-impact type oxygen Kα x-ray source, and a back-illuminated CCD for x-ray imaging. A spatial resolution limit of around 1.0 line pairs per micrometer was obtained for two-dimensional transmission images, and 1-μm scale three-dimensional fine structures were resolved.

Laboratory-size three-dimensional x-ray microscope with Wolter type I mirror optics and an electron-impact water window x-ray source.

Science.gov (United States)

Ohsuka, Shinji; Ohba, Akira; Onoda, Shinobu; Nakamoto, Katsuhiro; Nakano, Tomoyasu; Miyoshi, Motosuke; Soda, Keita; Hamakubo, Takao

2014-09-01

We constructed a laboratory-size three-dimensional water window x-ray microscope that combines wide-field transmission x-ray microscopy with tomographic reconstruction techniques, and observed bio-medical samples to evaluate its applicability to life science research fields. It consists of a condenser and an objective grazing incidence Wolter type I mirror, an electron-impact type oxygen Kα x-ray source, and a back-illuminated CCD for x-ray imaging. A spatial resolution limit of around 1.0 line pairs per micrometer was obtained for two-dimensional transmission images, and 1-μm scale three-dimensional fine structures were resolved.

SMART-X: Square Meter, Arcsecond Resolution Telescope for X-rays

Science.gov (United States)

Vikhlinin, Alexey; SMART-X Collaboration

2013-04-01

SMART-X is a concept for a next-generation X-ray observatory with large-area, 0.5" angular resolution grazing incidence adjustable X-ray mirrors, high-throughput critical angle transmission gratings, and X-ray microcalorimeter and CMOS-based imager in the focal plane. High angular resolution is enabled by new technology based on controlling the shape of mirror segments using thin film piezo actuators deposited on the back surface. Science applications include observations of growth of supermassive black holes since redshifts of ~10, ultra-deep surveys over 10's of square degrees, galaxy assembly at z=2-3, as well as new opportunities in the high-resolution X-ray spectroscopy and time domains. We also review the progress in technology development, tests, and mission design over the past year.

Figure and finish of grazing incidence mirrors

International Nuclear Information System (INIS)

Takacs, P.Z.; Church, E.L.

1989-08-01

Great improvement has been made in the past several years in the quality of optical components used in synchrotron radiation (SR) beamlines. Most of this progress has been the result of vastly improved metrology techniques and instrumentation permitting rapid and accurate measurement of the surface finish and figure on grazing incidence optics. A significant theoretical effort has linked the actual performance of components used as x-ray wavelengths to their topological properties as measured by surface profiling instruments. Next-generation advanced light sources will require optical components and systems to have sub-arc second surface figure tolerances. This paper will explore the consequences of these requirements in terms of manufacturing tolerances to see if the present manufacturing state-of-the-art is capable of producing the required surfaces. 15 refs., 14 figs., 2 tabs

High-efficiency collector design for extreme-ultraviolet and x-ray applications

International Nuclear Information System (INIS)

Zocchi, Fabio E.

2006-01-01

A design of a two-reflection mirror for nested grazing-incidence optics is proposed in which maximum overall reflectivity is achieved by making the two grazing-incidence angles equal for each ray. The design is proposed mainly for application to nonimaging collector optics for extreme-ultraviolet microlithography where the radiation emitted from a hot plasma source needs to be collected and focused on the illuminator optics. For completeness, the design of a double-reflection mirror with equal reflection angles is also briefly outlined for the case of an object at infinity for possible use in x-ray applications

High-efficiency collector design for extreme-ultraviolet and x-ray applications.

Science.gov (United States)

Zocchi, Fabio E

2006-12-10

A design of a two-reflection mirror for nested grazing-incidence optics is proposed in which maximum overall reflectivity is achieved by making the two grazing-incidence angles equal for each ray. The design is proposed mainly for application to nonimaging collector optics for extreme-ultraviolet microlithography where the radiation emitted from a hot plasma source needs to be collected and focused on the illuminator optics. For completeness, the design of a double- reflection mirror with equal reflection angles is also briefly outlined for the case of an object at infinity for possible use in x-ray applications.

X-ray focusing with Wolter microchannel plate optics

CERN Document Server

Price, G J; Beijersbergen, M W; Fraser, G W; Bavdaz, M; Boutot, J P; Fairbend, R; Flyckt, S O; Peacock, A; Tomaselli, E

2002-01-01

Square-pore microchannel plate (MCP) X-ray optics of the 'lobster-eye' geometry have frequently been described in the literature. We have now investigated the use of a radial channel packing geometry which, in the context of an MCP pair slumped to the correct radii of curvature, can form a conic approximation to the Wolter Type I grazing incidence X-ray optic. Such an optic can provide a large effective area with very low mass and may be ideally suited for use in applications such as planetary imaging X-ray fluorescence. We present here the results of X-ray illumination of the first such optic, fabricated by Photonis SAS, France.

A Test Facility For Astronomical X-Ray Optics

DEFF Research Database (Denmark)

Lewis, R. A.; Bordas, J.; Christensen, Finn Erland

1989-01-01

Grazing incidence x-ray optics for x-ray astronomical applications are used outside the earths atmosphere. These devices require a large collection aperture and the imaging of an x-ray source which is essentially placed at infinity. The ideal testing system for these optical elements has...... to approximate that encountered under working conditions, however the testing of these optical elements is notoriously difficult with conventional x-ray generators. Synchrotron Radiation (SR) sources are sufficiently brilliant to produce a nearly perfect parallel beam over a large area whilst still retaining...... a flux considerably higher than that available from conventional x-ray generators. A facility designed for the testing of x-ray optics, particularly in connection with x-ray telescopes is described below. It is proposed that this facility will be accommodated at the Synchrotron Radiation Source...

Custom AFM for X-ray beamlines: in situ biological investigations under physiological conditions

Energy Technology Data Exchange (ETDEWEB)

Gumí-Audenis, B. [ESRF, The European Synchrotron, Grenoble (France); Institute for Bioengineering of Catalonia (IBEC), Barcelona (Spain); Physical Chemistry Department, Universitat de Barcelona, Barcelona (Spain); Networking Biomedical Research Center on Bioengineering, Biomaterials and Nanomedicine (CIBER-BBN), Madrid (Spain); Carlà, F. [ESRF, The European Synchrotron, Grenoble (France); Vitorino, M. V. [University of Lisboa, Falculty of Science, Biosystems and Integrative Sciences Institute - BIOISI, Lisbon (Portugal); Panzarella, A. [ESRF, The European Synchrotron, Grenoble (France); Porcar, L. [Institut Laue-Langevin, Grenoble (France); Boilot, M. [ORTEC, Marseille (France); Guerber, S. [CEA, LETI Grenoble (France); Bernard, P. [ESRF, The European Synchrotron, Grenoble (France); Rodrigues, M. S. [University of Lisboa, Falculty of Science, Biosystems and Integrative Sciences Institute - BIOISI, Lisbon (Portugal); Sanz, F.; Giannotti, M. I. [Institute for Bioengineering of Catalonia (IBEC), Barcelona (Spain); Physical Chemistry Department, Universitat de Barcelona, Barcelona (Spain); Networking Biomedical Research Center on Bioengineering, Biomaterials and Nanomedicine (CIBER-BBN), Madrid (Spain); Costa, L., E-mail: luca.costa@esrf.fr [ESRF, The European Synchrotron, Grenoble (France)

2015-09-30

The performance of a custom atomic force microscope for grazing-incidence X-ray experiments on hydrated soft and biological samples is presented. A fast atomic force microscope (AFM) has been developed that can be installed as a sample holder for grazing-incidence X-ray experiments at solid/gas or solid/liquid interfaces. It allows a wide range of possible investigations, including soft and biological samples under physiological conditions (hydrated specimens). The structural information obtained using the X-rays is combined with the data gathered with the AFM (morphology and mechanical properties), providing a unique characterization of the specimen and its dynamics in situ during an experiment. In this work, lipid monolayers and bilayers in air or liquid environment have been investigated by means of AFM, both with imaging and force spectroscopy, and X-ray reflectivity. In addition, this combination allows the radiation damage induced by the beam on the sample to be studied, as has been observed on DOPC and DPPC supported lipid bilayers under physiological conditions.

Thin film characterisation by advanced X-ray diffraction techniques

International Nuclear Information System (INIS)

Cappuccio, G.; Terranova, M.L.

1996-09-01

The Fifth School on X-ray diffraction from polycrystalline materials was devoted to thin film characterization by advanced X-ray diffraction techniques. Twenty contributions are contained in this volume; all twenty are recorded in the INIS Database. X-ray diffraction is known to be a powerful analytical tool for characterizing materials and understanding their structural features. The aim of these articles is to illustrate the fundamental contribution of modern diffraction techniques (grazing incidence, surface analysis, standing waves, etc.) to the characterization of thin and ultra-thin films, which have become important in many advanced technologies

Temperature-Dependent Change of Packing Structure of Condensed-Phase in a Micro-Phase Separated Langmuir Monolayer Studied by Grazing-Incidence X-ray Diffraction

Energy Technology Data Exchange (ETDEWEB)

Iimura, Ken-ichi [Department of Applied Chemisty, Faculty of Engineering, Utsunomiya University, 7-1-2 Yoto, Utsunomiya 321-8585, Utsunomiya (Japan); Kato, Teiji [Department of Applied Chemisty, Faculty of Engineering, Utsunomiya University, 7-1-2 Yoto, Utsunomiya 321-8585, Utsunomiya (Japan); Brezesinski, Gerald [Max-Planck Instutite of Colloids and Interfaces, Research Campus Golm, D-14476 Potsdam (Germany)

2007-10-15

Packing structure of condensed-phase in a binary mixed Langmuir monolayer of behenic acid (C22) and perfluoro-2,5,8-trimethyl-3,6,9-trioxadodecanoic acid (PFPE) on a cadmium acetate aqueous solution was studied by grazing incidence X-ray diffraction (GIXD) as a function of the subphase temperature. The measurements were made during temperature scan at a fixed molecular area to explain the morphological change of the condensed-phase domains due to a thermal treatment reported previously. Analysis of GIXD data implies that the condensed-phase domains are composed of only the C22 molecules perpendicularly oriented and very closely packed in a centered rectangular unit cell with orthorhombic distortion at low temperatures. As the temperature increases the area occupied by molecule increases, and above 25 deg. C the lattice becomes disordered, which would allow morphological transformation of the condensed-phase domains. The process of packing structure change is almost reversible except for non-equilibrium phases observed for the monolayer spread at a low temperature, 5.5 deg. C.

Temperature-Dependent Change of Packing Structure of Condensed-Phase in a Micro-Phase Separated Langmuir Monolayer Studied by Grazing-Incidence X-ray Diffraction

International Nuclear Information System (INIS)

Iimura, Ken-ichi; Kato, Teiji; Brezesinski, Gerald

2007-01-01

Packing structure of condensed-phase in a binary mixed Langmuir monolayer of behenic acid (C22) and perfluoro-2,5,8-trimethyl-3,6,9-trioxadodecanoic acid (PFPE) on a cadmium acetate aqueous solution was studied by grazing incidence X-ray diffraction (GIXD) as a function of the subphase temperature. The measurements were made during temperature scan at a fixed molecular area to explain the morphological change of the condensed-phase domains due to a thermal treatment reported previously. Analysis of GIXD data implies that the condensed-phase domains are composed of only the C22 molecules perpendicularly oriented and very closely packed in a centered rectangular unit cell with orthorhombic distortion at low temperatures. As the temperature increases the area occupied by molecule increases, and above 25 deg. C the lattice becomes disordered, which would allow morphological transformation of the condensed-phase domains. The process of packing structure change is almost reversible except for non-equilibrium phases observed for the monolayer spread at a low temperature, 5.5 deg. C

Grazing Incidence Optics Technology

Science.gov (United States)

Ramsey, Brian; Smith, W. Scott; Gubarev, Mikhail; McCracken, Jeff

2015-01-01

This project is to demonstrate the capability to directly fabricate lightweight, high-resolution, grazing-incidence x-ray optics using a commercially available robotic polishing machine. Typical x-ray optics production at NASA Marshall Space Flight Center (MSFC) uses a replication process in which metal mirrors are electroformed on to figured and polished mandrels from which they are later removed. The attraction of this process is that multiple copies can be made from a single master. The drawback is that the replication process limits the angular resolution that can be attained. By directly fabricating each shell, errors inherent in the replication process are removed. The principal challenge now becomes how to support the mirror shell during all aspects of fabrication, including the necessary metrology to converge on the required mirror performance specifications. This program makes use of a Zeeko seven-axis computer-controlled polishing machine (see fig. 1) and supporting fabrication, metrology, and test equipment at MSFC. The overall development plan calls for proof-of-concept demonstration with relatively thick mirror shells (5-6 mm, fig. 2) which are straightforward to support and then a transition to much thinner shells (2-3 mm), which are an order of magnitude thinner than those used for Chandra. Both glass and metal substrates are being investigated. Currently, a thick glass shell is being figured. This has enabled experience to be gained with programming and operating the polishing machine without worrying about shell distortions or breakage. It has also allowed time for more complex support mechanisms for figuring/ polishing and metrology to be designed for the more challenging thinner shells. These are now in fabrication. Figure 1: Zeeko polishing machine.

X-Ray Polarimetry with GEMS

Science.gov (United States)

Strohmayer, Tod

2011-01-01

The polarization properties of cosmic X-ray sources are still largely unexplored. The Gravity and Extreme Magnetism SMEX (GEMS) will carry out the first sensitive X-ray polarization survey of a wide range of sources including; accreting compact objects (black holes and neutron stars), AGN, supernova remnants, magnetars and rotation-powered pulsars. GEMS employs grazing-incidence foil mirrors and novel time-projection chamber (TPC) polarimeters leveraging the photoelectric effect to achieve high polarization sensitivity in the 2 - 10 keV band. I will provide an update of the project status, illustrate the expected performance with several science examples, and provide a brief overview of the data analysis challenges

Doubly curved imaging Bragg crystal spectrometer for X-ray astronomy

DEFF Research Database (Denmark)

Byrnak, B. P.; Christensen, Finn Erland; Westergaard, Niels Jørgen Stenfeldt

1985-01-01

An X-ray spectrometer which is sensitive in the 0.5-7-keV energy range and is intended for use onboard astronomical satellites has been studied. The Bragg reflected rays from a doubly bent crystal positioned downstream of the focal plane of a grazing-incidence concentrator are focused along the a...

X-ray optics for axion helioscopes

DEFF Research Database (Denmark)

Jakobsen, Anders Clemen; Pivovaroff, Michael J.; Christensen, Finn Erland

2013-01-01

A method of optimizing grazing incidence x-ray coatings in ground based axion helioscopes is presented. Software has been been developed to find the optimum coating when taking both axion spectrum and Micromegas detector quantum efficiency into account. A comparison of the relative effective area...... of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only....

X-ray Optics Development at MSFC

Science.gov (United States)

Sharma, Dharma P.

2017-01-01

Development of high resolution focusing telescopes has led to a tremendous leap in sensitivity, revolutionizing observational X-ray astronomy. High sensitivity and high spatial resolution X-ray observations have been possible due to use of grazing incidence optics (paraboloid/hyperboloid) coupled with high spatial resolution and high efficiency detectors/imagers. The best X-ray telescope flown so far is mounted onboard Chandra observatory launched on July 23,1999. The telescope has a spatial resolution of 0.5 arc seconds with compatible imaging instruments in the energy range of 0.1 to 10 keV. The Chandra observatory has been responsible for a large number of discoveries and has provided X-ray insights on a large number of celestial objects including stars, supernova remnants, pulsars, magnetars, black holes, active galactic nuclei, galaxies, clusters and our own solar system.

Synchrotron X-ray studies of liquid-vapor interfaces

DEFF Research Database (Denmark)

Als-Nielsen, Jens Aage

1986-01-01

The density profile ρ(z) across a liquid-vapor interface may be determined by the reflectivity R(θ) of X-rays at grazing angle incidence θ. The relation between R(θ) and ρ(z) is discussed, and experimental examples illustrating thermal roughness of simple liquids and smectic layering of liquid...

Packing stress reduction in polymer-lipid monolayers at the air-water interface: An X-ray grazing-incidence diffraction and reflectivity study

Energy Technology Data Exchange (ETDEWEB)

Kuhl, T.L.; Majewski, J.; Howes, P.B.; Kjaer, K.; Nahmen, A. von; Lee, K.Y.C.; Ocko, B.; Israelachvili, J.N.; Smith, G.S.

1999-08-25

Using synchrotron grazing-incidence X-ray diffraction (GIXD) and reflectivity (XR), the authors have determined the in-plane and out-of-plane structure of phospholipid monolayers at the air-water interface as a function of hydrophilic lipid headgroup size. Di-stearoyl-phosphatidyl-ethanolamine (DSPE) lipid monolayers were systematically modified by chemically grafting hydrophilic poly(ethylene glycol) (PEG) chains of MW = 90 g/mol (2 ethylene oxide, EO, units), MW = 350 g/mol (8 EO units), and MW = 750 g/mol (17 EO units) to the lipid headgroups. The monolayers were studied in the solid phase at a surface pressure of 42 mN/m. At these high lipid packing densities, the PEG chains are submerged in the water subphase. The increased packing stresses from these bulky polymer headgroups distort the unit cell and the in-plane packing modes of the monolayers, leading to large out-of-plane alterations and staggering of the lipid molecules. Surprisingly, a change in the molecular packing of the monolayer toward higher packing densities (lower area per molecule) was observed on increasing the PEG MW to 750 g/mol (17 EO units). This rearrangement of the monolayer structure may be due to a conformational change in the PEG chains.

In-situ grazing incidence X-ray diffraction measurements of relaxation in Fe/MgO/Fe epitaxial magnetic tunnel junctions during annealing

Energy Technology Data Exchange (ETDEWEB)

Eastwood, D.S. [Department of Physics, Durham University, South Road, Durham DH1 3LE (United Kingdom); Ali, M.; Hickey, B.J. [Department of Physics and Astronomy, University of Leeds, Leeds LS2 1JT (United Kingdom); Tanner, B.K., E-mail: b.k.tanner@dur.ac.uk [Department of Physics, Durham University, South Road, Durham DH1 3LE (United Kingdom)

2013-12-15

The relaxation of Fe/MgO/Fe tunnel junctions grown epitaxially on (001) MgO substrates has been measured by in-situ grazing incidence in-plane X-ray diffraction during the thermal annealing cycle. We find that the Fe layers are fully relaxed and that there are no irreversible changes during annealing. The MgO tunnel barrier is initially strained towards the Fe but on annealing, relaxes and expands towards the bulk MgO value. The strain dispersion is reduced in the MgO by about 40% above 480 K post-annealing. There is no significant change in the “twist” mosaic. Our results indicate that the final annealing stage of device fabrication, crucial to attainment of high TMR, induces substantial strain relaxation at the MgO barrier/lower Fe electrode interface. - Highlights: • Lattice relaxation of Fe/MgO/Fe epitaxial magnetic tunnel junctions measured. • In-plane lattice parameter of Fe equal to bulk value; totally relaxed. • MgO barrier initially strained towards the Fe but relaxes on annealing. • Reduction in strain dispersion in the MgO barrier by 40% above about 470 K. • No change in the in-plane “twist” mosaic throughout the annealing cycle.

Interaction between lipid monolayers and poloxamer 188: An X-ray reflectivity and diffraction study

DEFF Research Database (Denmark)

Wu, G.H.; Majewski, J.; Ege, C.

2005-01-01

The mechanism by which poloxamer 188 (P188) seals a damaged cell membrane is examined using the lipid monolayer as a model system. X-ray reflectivity and grazing-incidence x-ray diffraction results show that at low nominal lipid density, P188, by physically occupying the available area and phase ...

Design studies for ITER x-ray diagnostics

International Nuclear Information System (INIS)

Hill, K.W.; Bitter, M.; von Goeler, S.; Hsuan, H.

1995-01-01

Concepts for adapting conventional tokamak x-ray diagnostics to the harsh radiation environment of ITER include use of grazing-incidence (GI) x-ray mirrors or man-made Bragg multilayer (ML) elements to remove the x-ray beam from the neutron beam, or use of bundles of glass-capillary x-ray ''light pipes'' embedded in radiation shields to reduce the neutron/gamma-ray fluxes onto the detectors while maintaining usable x-ray throughput. The x-ray optical element with the broadest bandwidth and highest throughput, the GI mirror, can provide adequate lateral deflection (10 cm for a deflected-path length of 8 m) at x-ray energies up to 12, 22, or 30 keV for one, two, or three deflections, respectively. This element can be used with the broad band, high intensity x-ray imaging system (XIS), the pulseheight analysis (PHA) survey spectrometer, or the high resolution Johann x-ray crystal spectrometer (XCS), which is used for ion-temperature measurement. The ML mirrors can isolate the detector from the neutron beam with a single deflection for energies up to 50 keV, but have much narrower bandwidth and lower x-ray power throughput than do the GI mirrors; they are unsuitable for use with the XIS or PHA, but they could be used with the XCS; in particular, these deflectors could be used between ITER and the biological shield to avoid direct plasma neutron streaming through the biological shield. Graded-d ML mirrors have good reflectivity from 20 to 70 keV, but still at grazing angles (<3 mrad). The efficiency at 70 keV for double reflection (10 percent), as required for adequate separation of the x-ray and neutron beams, is high enough for PHA requirements, but not for the XIS. Further optimization may be possible

X-ray diffraction study of directionally grown perylene crystallites

DEFF Research Database (Denmark)

Breiby, Dag W.; Lemke, H. T.; Hammershøj, P.

2008-01-01

Using grazing incidence X-ray diffraction, perylene crystallites grown on thin highly oriented poly(tetrafluoroethylene) (PTFE) films on silicon substrates have been investigated. All the perylene crystallites are found to orient with the ab plane of the monoclinic unit cell parallel to the subst......Using grazing incidence X-ray diffraction, perylene crystallites grown on thin highly oriented poly(tetrafluoroethylene) (PTFE) films on silicon substrates have been investigated. All the perylene crystallites are found to orient with the ab plane of the monoclinic unit cell parallel...... to the substrate. The scattering data is interpreted as a trimodal texture of oriented perylene crystallites, induced by interactions between the perylene molecules and the oriented PTFE substrate. Three families of biaxial orientations are seen, with the axes (h = 1, 2, or 3) parallel to the PTFE alignment......, all having the ab-plane parallel to the substrate. About 92% of the scattered intensity corresponds to a population with highly parallel to (PTFE)....

Method for spatially modulating X-ray pulses using MEMS-based X-ray optics

Science.gov (United States)

Lopez, Daniel; Shenoy, Gopal; Wang, Jin; Walko, Donald A.; Jung, Il-Woong; Mukhopadhyay, Deepkishore

2015-03-10

A method and apparatus are provided for spatially modulating X-rays or X-ray pulses using microelectromechanical systems (MEMS) based X-ray optics. A torsionally-oscillating MEMS micromirror and a method of leveraging the grazing-angle reflection property are provided to modulate X-ray pulses with a high-degree of controllability.

Characterization of diffraction gratings by use of a tabletop soft-x-ray laser

International Nuclear Information System (INIS)

Seminario, Max; Rocca, Jorge J.; Depine, Ricardo A.; Bach, Benny; Bach, Bernie

2001-01-01

We have demonstrated the use of a high-repetition-rate 46.9-mm tabletop laser to characterize diffraction gratings designed for grazing-incidence operation in the soft-x-ray spectral region. The efficiencies for various diffraction orders were measured as a function of angle of incidence and compared with the results of model simulations. This measurement technique provides benchmarks with which to improve electromagnetic codes used in the design of soft-x-ray diffraction gratings. The results illustrate the potential of compact tabletop soft-x-ray lasers for use as a new tool for characterization of short-wavelength optics at the manufacturer's site

Numerical controlled diamond fly cutting machine for grazing incidence X-ray reflection mirrors

International Nuclear Information System (INIS)

Uchida, Fumihiko; Moriyama, Shigeo; Seya, Eiiti

1992-01-01

Synchrotron radiation has reached the stage of practical use, and the application to the wide fields that support future advanced technologies such as spectroscopy, the structural analysis of matters, semiconductor lithography and medical light source is expected. For the optical system of the equipment utilizing synchrotron radiation, the total reflection mirrors of oblique incidence are used for collimating and collecting X-ray. In order to restrain their optical aberration, nonspherical shape is required, and as the manufacturing method with high precision for nonspherical mirrors, a numerically controlled diamond cutting machine was developed. As for the cutting of soft metals with diamond tools, the high precision machining of any form can be done by numerical control, the machining time can be reduced as compared with grinding, and the cooling effect is large in metals. The construction of the cutting machine, the principle of machining, the control system, the method of calculating numerical control data, the investigation of machinable forms and the result of evaluation are reported. (K.I.)

Molecular-beam epitaxy growth and structural characterization of semiconductor-ferromagnet heterostructures by grazing incidence X-ray diffraction

Energy Technology Data Exchange (ETDEWEB)

Satapathy, D.K.

2005-12-19

The present work is devoted to the growth of the ferromagnetic metal MnAs on the semiconductor GaAs by molecular-beam epitaxy (MBE). The MnAs thin films are deposited on GaAs by molecular-beam epitaxy (MBE). Grazing incidence diffraction (GID) and reflection high-energy electron diffraction (RHEED) are used in situ to investigate the nucleation, evolution of strain, morphology and interfacial structure during the MBE growth. Four stages of the nucleation process during growth of MnAs on GaAs(001) are revealed by RHEED azimuthal scans. GID shows that further growth of MnAs films proceed via the formation of relaxed islands at a nominal thickness of 2.5 ML which increase in size and finally coalesce to form a continuous film. Early on, an ordered array of misfit dislocations forms at the interface releasing the misfit strain even before complete coalescence occurs. The fascinating complex nucleation process of MnAs on GaAs(0 0 1) contains elements of both Volmer-Weber and Stranski-Krastanov growth. A nonuniform strain amounting to 0.66%, along the [1 -1 0] direction and 0.54%, along the [1 1 0] direction is demonstrated from x-ray line profile analysis. A high correlation between the defects is found along the GaAs[1 1 0] direction. An extremely periodic array of misfit dislocations with a period of 4.95{+-}0.05 nm is formed at the interface along the [1 1 0] direction which releases the 7.5% of misfit. The inhomogeneous strain due to the periodic dislocations is confined at the interface within a layer of 1.6 nm thickness. The misfit along the [1 -1 0] direction is released by the formation of a coincidence site lattice. (orig.)

Mounting for Fabrication, Metrology, and Assembly of Full Shell Grazing Incidence Optics

Science.gov (United States)

Roche, Jacqueline M.; Gubarev, Mikhail V.; O'Dell, Stephen L.; Kolodziejczak, Jeffery; Weisskopf, Martin C.; Ramsey, Brian D.; Elsner, Ronald F.

2014-01-01

Future x-ray telescopes will likely require lightweight mirrors to attain the large collecting areas needed to accomplish the science objectives. Understanding and demonstrating processes now is critical to achieving sub-arcsecond performance in the future. Consequently, designs not only of the mirrors but of fixtures for supporting them during fabrication, metrology, handling, assembly, and testing must be adequately modeled and verified. To this end, MSFC is using finite-element modeling to study the effects of mounting on full-shell grazing-incidence mirrors, during all processes leading to flight mirror assemblies. Here we report initial results of this study.

GALAXI: Gallium anode low-angle x-ray instrument

Directory of Open Access Journals (Sweden)

Emmanuel Kentzinger

2016-03-01

Full Text Available The high brilliance laboratory small angle X-ray scattering instrument GALAXI, which is operated by JCNS, Forschungszentrum Jülich, permits the investigation of chemical correlations in bulk materials or of structures deposited on a surface at nanometre and mesoscopic length scales. The instrument is capable to perform GISAXS experiments in reflection at grazing incidence as well as SAXS experiments in transmission geometry. The X-ray flux on sample is comparable or higher than the one obtained at a comparable beamline at a second generation synchrotron radiation source.

Mirror and grating surface figure requirements for grazing incidence synchrotron radiation beamlines: Power loading effects

Energy Technology Data Exchange (ETDEWEB)

Hulbert, S.L.; Sharma, S.

1987-01-01

At present, grazing incidence mirrors are used almost exclusively as the first optical element in VUV and soft x-ray synchrotron radiation beamlines. The performance of these mirrors is determined by thermal and mechanical stress-induced figure errors as well as by figure errors remaining from the grinding and polishing process. With the advent of VUV and soft x-ray undulators and wigglers has come a new set of thermal stress problems related to both the magnitude and the spatial distribution of power from these devices. In many cases the power load on the entrance slits and gratings in these beamlines is no longer negligible. The dependence of thermally-induced front-end mirror figure errors on various storage ring and insertion device parameters (especially those at the National Synchrotron Light Source) and the effects of these figure errors on two classes of soft x-ray beamlines are presented.

New trends in space x-ray optics

Science.gov (United States)

Hudec, R.; Maršíková, V.; Pína, L.; Inneman, A.; Skulinová, M.

2017-11-01

The X-ray optics is a key element of various X-ray telescopes, X-ray microscopes, as well as other X-ray imaging instruments. The grazing incidence X-ray lenses represent the important class of X-ray optics. Most of grazing incidence (reflective) X-ray imaging systems used in astronomy but also in other (laboratory) applications are based on the Wolter 1 (or modified) arrangement. But there are also other designs and configurations proposed, used and considered for future applications both in space and in laboratory. The Kirkpatrick-Baez (K-B) lenses as well as various types of Lobster-Eye optics and MCP/Micropore optics serve as an example. Analogously to Wolter lenses, the X-rays are mostly reflected twice in these systems to create focal images. Various future projects in X-ray astronomy and astrophysics will require large segments with multiple thin shells or foils. The large Kirkpatrick-Baez modules, as well as the large Lobster-Eye X-ray telescope modules in Schmidt arrangement may serve as examples. All these space projects will require high quality and light segmented shells (bent or flat foils) with high X-ray reflectivity and excellent mechanical stability. The Multi Foil Optics (MFO) approach represent a promising alternative for both LE and K-B X-ray optical modules. Several types of reflecting substrates may be considered for these applications, with emphasis on thin float glass sheets and, more recently, high quality silicon wafers. This confirms the importance of non- Wolter X-ray optics designs for the future. Future large space X-ray telescopes (such as IXO) require precise and light-weight X-ray optics based on numerous thin reflecting shells. Novel approaches and advanced technologies are to be exploited and developed. In this contribution, we refer on results of tested X-ray mirror shells produced by glass thermal forming (GTF) and by shaping Si wafers. Both glass foils and Si wafers are commercially available, have excellent surface

The soft x ray telescope for Solar-A

Science.gov (United States)

Brown, W. A.; Acton, L. W.; Bruner, M. E.; Lemen, J. R.; Strong, K. T.

1989-01-01

The Solar-A satellite being prepared by the Institute for Sapce and Astronautical Sciences (ISAS) in Japan is dedicated to high energy observations of solar flares. The Soft X Ray Telescope (SXT) is being prepared to provide filtered images in the 2 to 60 A interval. The flight model is now undergoing tests in the 1000 foot tunnel at MSFC. Launch will be in September 1991. Earlier resolution and efficiency tests on the grazing incidence mirror have established its performance in soft x rays. The one-piece, two mirror grazing incidence telescope is supported in a strain free mount separated from the focal plane assembly by a carbon-epoxy metering tube whose windings and filler are chosen to minimize thermal and hygroscopic effects. The CCD detector images both the x ray and the concentric visible light aspect telescope. Optical filters provide images at 4308 and 4700 A. The SXT will be capable of producing over 8000 of the smallest partial frame images per day, or fewer but larger images, up to 1024 x 1024 pixel images. Image sequence with two or more of the five x ray analysis filters, with automatic exposure compensation to optimize the charge collection by the CCD detector, will be used to provide plasma diagnostics. Calculations using a differential emission measure code were used to optimize filter selection over the range of emission measure variations and to avoid redundancy, but the filters were chosen primarily to give ratios that are monotonic in plasma temperature.

The soft x ray telescope for Solar-A

International Nuclear Information System (INIS)

Brown, W.A.; Acton, L.W.; Bruner, M.E.; Lemen, J.R.; Strong, K.T.

1989-01-01

The Solar-A satellite being prepared by the Institute for Sapce and Astronautical Sciences (ISAS) in Japan is dedicated to high energy observations of solar flares. The Soft X Ray Telescope (SXT) is being prepared to provide filtered images in the 2 to 60 A interval. The flight model is now undergoing tests in the 1000 foot tunnel at MSFC. Launch will be in September 1991. Earlier resolution and efficiency tests on the grazing incidence mirror have established its performance in soft x rays. The one-piece, two mirror grazing incidence telescope is supported in a strain free mount separated from the focal plane assembly by a carbon-epoxy metering tube whose windings and filler are chosen to minimize thermal and hygroscopic effects. The CCD detector images both the x ray and the concentric visible light aspect telescope. Optical filters provide images at 4308 and 4700 A. The SXT will be capable of producing over 8000 of the smallest partial frame images per day, or fewer but larger images, up to 1024 x 1024 pixel images. Image sequence with two or more of the five x ray analysis filters, with automatic exposure compensation to optimize the charge collection by the CCD detector, will be used to provide plasma diagnostics. Calculations using a differential emission measure code were used to optimize filter selection over the range of emission measure variations and to avoid redundancy, but the filters were chosen primarily to give ratios that are monotonic in plasma temperature

Grazing incidence synchrotron X-ray diffraction and Moessbauer spectroscopy analyses of plasma nitrided ASTM F138 stainless steel

Energy Technology Data Exchange (ETDEWEB)

Souza, Danilo Olzon Dionysio de; Ardisson, Jose Domingos, E-mail: dolzon@gmail.com [Centro de Desenvolvimento da Tecnologia Nuclear (CDTN/CNEN-MG), Belo Horizonte, MG (Brazil); Silva, Edilaine Honorio [Studiecentrum voor Kernenergie (Belgium); Olzon-Dionysio, Maristela; Souza, Sylvio Dionysio de; Fabris, Jose Domingos [Universidade Federal dos Vales do Jequitinhonha e Mucuri (UFVJM), Diamantina, MG (Brazil); Martinez, L.G. [Instituto de Pesquisas Energeticas e Nucleares (IPEN/CNEN-SP), Sao Paulo, SP (Brazil)

2016-07-01

Full text: systematic investigation of samples of plasma-nitriding austenitic stainless steels ASTM F138 and AISI 316L is reported. The surface treatment of the steels through plasma-nitriding was used to improve further the hardness, wear and corrosion resistance of these stainless steels. The resulting layered crystallographic structure actually corresponds to several phases with close cell parameters, making their identification and quantification a real experimental challenge. The ASTM F138 and AISI 316L stainless steel disks were plasma nitrided for 4 h at 400 deg C in a 80% H{sub 2} -20% N2 atmosphere at 6 torr, using plasma current frequencies between 6 and 100 kHz. Data of Moessbauer (CEMS and CXMS) and grazing incidence synchrotron X-ray diffraction (XRD-SR) were systematically collected. The nitrided layer thickness were not in general influenced by the plasma frequency, except at 12 kHz, which produced a layer thickness of approximately 8.0 mm, being in average 40% thicker than for the other samples. CXMS and CEMS Moessbauer spectra for this 12 kHz-sample show a much more pronounced magnetic resonance lines than for the other samples. The Fe{sub 4}N phase presents a single magnetic hyperfine interaction; the other two (Fe{sub 2-3}N and the expanded austenite) present both paramagnetic and magnetic components, even though their hyperfine parameters may not be safely separated. We also present the results of XRD-SR that were probed at several depths. The data from these techniques may be consistently correlated and this leads to an improved model to explain the structure of the nitrided layers. (author)

X ray reflection masks: Manufacturing, characterization and first tests

Science.gov (United States)

Rahn, Stephen

1992-09-01

SXPL (Soft X-ray Projection Lithography) multilayer mirrors are characterized, laterally structured and then used as reflection masks in a projecting lithography procedure. Mo/Si-multilayer mirrors with a 2d in the region of 14 nm were characterized by Cu-k(alpha) grazing incidence as well as soft X-ray normal incidence reflectivity measurements. The multilayer mirrors were patterned by reactive ion etching with CF4 using a photoresist as etch mask, thus producing X-ray reflection masks. The masks were tested at the synchrotron radiation laboratory of the electron accelerator ELSA. A double crystal X-ray monochromator was modified so as to allow about 0.5 sq cm of the reflection mask to be illuminated by white synchrotron radiation. The reflected patterns were projected (with an energy of 100 eV) onto a resist and structure sizes down to 8 micrometers were nicely reproduced. Smaller structures were distorted by Fresnel-diffraction. The theoretically calculated diffraction images agree very well with the observed images.

Present status of research and development on X-ray microprobe

International Nuclear Information System (INIS)

Koike, Masaki; Suzuki, I.H.

1991-01-01

X-ray beam micro-analysis has advanced rapidly in these years in conjunction with the development of powerful X-ray sources. Among a variety of methods being attempted, the method using a collimated narrow beam has been important because of high brightness, and of usability in both regions of soft and hard X-rays. In the soft X-ray region, the focused beam is formed by a fresnel zone plate or a Schwaltzschild mirror assembly, and can be used for scanning transmission microscope or scanning photoelectron microscope. In the hard X-ray region, the beam is formed by grazing incidence mirrors, and can be used for X-ray fluorescence micro-analysis for obtaining elemental mapping. In this report, the recent progress on the soft X-ray scanning microscopy and the X-ray microprobe has been surveyed, together with the improvement on the related optical elements. (author) 84 refs

Optical design of grazing incidence toroidal grating monochromator

International Nuclear Information System (INIS)

Pouey, M.; Howells, M.R.; Takacs, P.Z.

1982-01-01

Design rules using geometrical optics and physical optics associated with the phase balancing method are discussed for stigmatic toroidal grazing incidence monochromators. To determine the optical performance of devices involving mirrirs and/or gratings, ray tracing programs using exact geometry are quite widely used. It is then desirable to have some way to infer the practical performance of an instrument from a spot diagram created by tracing a limited number of rays. We propose a first approach to this problem involving an estimation of the geometrical intensity distribution in the image plane and the corresponding line spread function. (orig.)

X-ray metrology and performance of a 45-cm long x-ray deformable mirror

Energy Technology Data Exchange (ETDEWEB)

Poyneer, Lisa A., E-mail: poyneer1@llnl.gov; Brejnholt, Nicolai F.; Hill, Randall; Jackson, Jessie; Hagler, Lisle [Lawrence Livermore National Laboratory, 7000 East Avenue, Livermore, California 94550 (United States); Celestre, Richard; Feng, Jun [Advanced Light Source, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, California 94720 (United States)

2016-05-15

We describe experiments with a 45-cm long x-ray deformable mirror (XDM) that have been conducted in End Station 2, Beamline 5.3.1 at the Advanced Light Source. A detailed description of the hardware implementation is provided. We explain our one-dimensional Fresnel propagation code that correctly handles grazing incidence and includes a model of the XDM. This code is used to simulate and verify experimental results. Initial long trace profiler metrology of the XDM at 7.5 keV is presented. The ability to measure a large (150-nm amplitude) height change on the XDM is demonstrated. The results agree well with the simulated experiment at an error level of 1 μrad RMS. Direct imaging of the x-ray beam also shows the expected change in intensity profile at the detector.

Image defects from surface and alignment errors in grazing incidence telescopes

Science.gov (United States)

Saha, Timo T.

1989-01-01

The rigid body motions and low frequency surface errors of grazing incidence Wolter telescopes are studied. The analysis is based on surface error descriptors proposed by Paul Glenn. In his analysis, the alignment and surface errors are expressed in terms of Legendre-Fourier polynomials. Individual terms in the expression correspond to rigid body motions (decenter and tilt) and low spatial frequency surface errors of mirrors. With the help of the Legendre-Fourier polynomials and the geometry of grazing incidence telescopes, exact and approximated first order equations are derived in this paper for the components of the ray intercepts at the image plane. These equations are then used to calculate the sensitivities of Wolter type I and II telescopes for the rigid body motions and surface deformations. The rms spot diameters calculated from this theory and OSAC ray tracing code agree very well. This theory also provides a tool to predict how rigid body motions and surface errors of the mirrors compensate each other.

The Soft X-ray Telescope for Solar-A - Design evolution and lessons learned

Science.gov (United States)

Bruner, Marilyn E.

1992-01-01

The Japanese Solar-A satellite mission's Soft X-ray Telescope uses grazing-incidence optics, a CCD detector, and a pair of filter wheels for wavelength selection. A coaxially-mounted visible-light lens furnished sunspot and magnetic plage images, together with aspect information which aids in aligning the soft X-ray images with those from the satellite's Hard X-ray Telescope. Instrument electronics are microprocessor-based, and imbedded in a tightly integrated distributed system. Control software is divided between the instrument microprocessor and the spacecraft control computer.

Tests of lobster eye optics for small space X-ray telescope

International Nuclear Information System (INIS)

Tichy, Vladimir; Barbera, Marco; Collura, Alfonso; Hromcik, Martin; Hudec, Rene; Inneman, Adolf; Jakubek, Jan; Marsik, Jiri; Marsikova, Veronika; Pina, Ladislav; Varisco, Salvatore

2011-01-01

The Lobster eye design for a grazing incidence X-ray optics provides wide field of view of the order of many degrees, for this reason it can be a convenient approach for the construction of space all-sky X-ray monitors. We present preliminary results of tests of prototype lobster eye X-ray optics in quasi parallel beam full imaging mode conducted using the 35 m long X-ray beam-line of INAF-OAPA in Palermo (Italy). X-ray images at the focal plane have been taken with a microchannel plate (MCP) detector at several energy values from 0.3 to 8 keV. The gain, the field of view and the angular resolution have been measured and compared with theoretical values.

X-ray mirror development and testing for the ATHENA mission

Science.gov (United States)

Della Monica Ferreira, Desiree; Jakobsen, Anders C.; Massahi, Sonny; Christensen, Finn E.; Shortt, Brian; Garnæs, Jørgen; Torras-Rosell, Antoni; Krumrey, Michael; Cibik, Levent; Marggraf, Stefanie

2016-07-01

This study reports development and testing of coatings on silicon pore optics (SPO) substrates including pre and post coating characterisation of the x-ray mirrors using Atomic Force Microscopy (AFM) and X-ray reflectometry (XRR) performed at the 8 keV X-ray facility at DTU Space and with synchrotron radiation in the laboratory of PTB at BESSY II. We report our findings on surface roughness and coating reflectivity of Ir/B4C coatings considering the grazing incidence angles and energies of ATHENA and long term stability of Ir/B4C, Pt/B4C, W/Si and W/B4C coatings.

10th International Conference on X-Ray Lasers

CERN Document Server

Nickles, P.V; X-Ray Lasers 2006

2007-01-01

The search for table-top and repetitive pump schemes during the last decade has been the driving force behind the spectacular advances demonstrated during the 10th International Conference on X-Ray Lasers, organized in 2006 in Berlin. Since 1986, international experts have gathered every two years at this established conference to discuss the progress in theory, experiment and application of plasma-based soft X-ray lasers. Traditionally, the conference sessions devoted to complementary and alternative sources of short wavelength radiation, such as high harmonics, XFEL or incoherent X-rays are organized so as to emphasize the role of X-ray laser research in relation to the other short wavelength sources. Grazing incidence pumping (GRIP) and seeding with high harmonics were the dominant topics of the conference. High repetition rate and portable X-ray lasers were reported to have been applied in metrology and photochemistry for the first time. The proceedings of this series of conferences constitute a comprehen...

Optical Analysis of Grazing Incidence Ring Resonators for Free-Electron Lasers

Science.gov (United States)

Gabardi, David Richard

1990-08-01

The design of resonators for free-electron lasers (FELs) which are to operate in the soft x-ray/vacuum ultraviolet (XUV) region of the spectrum is complicated by the fact that, in this wavelength regime, normal incidence mirrors, which would otherwise be used for the construction of the resonators, generally have insufficient reflectivities for this purpose. However, the use of grazing incidence mirrors in XUV resonators offers the possibility of (1) providing sufficient reflectivity, (2) a lessening of the mirrors' thermal loads due to the projection of the laser beam onto an oblique surface, and (3) the preservation of the FEL's tunability. In this work, the behavior of resonators employing grazing incidence mirrors in ring type configurations is explored. In particular, two designs, each utilizing four off-axis conic mirrors and a number of flats, are examined. In order to specify the location, orientation, and surface parameters for the mirrors in these resonators, a design algorithm has been developed based upon the properties of Gaussian beam propagation. Two computer simulation methods are used to perform a vacuum stability analysis of the two resonator designs. The first method uses paraxial ray trace techniques with the resonators' thin lens analogues while the second uses the diffraction-based computer simulation code GLAD (General Laser Analysis and Design). The effects of mirror tilts and deviations in the mirror surface parameters are investigated for a number of resonators designed to propagate laser beams of various Rayleigh ranges. It will be shown that resonator stability decreases as the laser wavelength for which the resonator was designed is made smaller. In addition, resonator stability will also be seen to decrease as the amount of magnification the laser beam receives as it travels around the resonator is increased.

Surface morphology of vacuum-evaporated pentacene film on Si substrate studied by in situ grazing-incidence small-angle X-ray scattering: I. The initial stage of formation of pentacene film

Science.gov (United States)

Hirosawa, Ichiro; Watanabe, Takeshi; Koganezawa, Tomoyuki; Kikuchi, Mamoru; Yoshimoto, Noriyuki

2018-03-01

The progress of the surface morphology of a growing sub-monolayered pentacene film on a Si substrate was studied by in situ grazing-incidence small angle X-ray scattering (GISAXS). The observed GISAXS profiles did not show sizes of pentacene islands but mainly protuberances on the boundaries around pentacene film. Scattering of X-ray by residual pits in the pentacene film was also detected in the GISAXS profiles of an almost fully covered film. The average radius of pentacene protuberances increased from 13 to 24 nm as the coverage increased to 0.83 monolayer, and the most frequent radius was almost constant at approximately 9 nm. This result suggests that the population of larger protuberances increase with increasing lengths of boundaries of the pentacene film. It can also be considered that the detected protuberances were crystallites of pentacene, since the average size of protuberances was nearly equal to crystallite sizes of pentacene films. The almost constant characteristic distance of 610 nm and amplitudes of pair correlation functions at low coverages suggest that the growth of pentacene films obeyed the diffusion-limited aggregation (DLA) model, as previously reported. It is also considered that the sites of islands show a triangular distribution for small variations of estimated correlation distances.

Ag on Ge(111): 2D x-ray structure analysis of the #sq root#3 x #sq root#3 superstructure

DEFF Research Database (Denmark)

Dornisch, D.; Moritz, W.; Schulz, H.

1992-01-01

We have studied the Ag/Ge(111) square-root 3 x square-root 3 superstructure by grazing-incidence X-ray diffraction. In our structural analysis we find striking similarities to the geometry of Au on Si(111). The Ag atoms form trimer clusters with an Ag-Ag distance of 2.94 +/- 0.04 angstrom...

LCLS in—photon out: fluorescence measurement of neon using soft x-rays

Science.gov (United States)

Obaid, Razib; Buth, Christian; Dakovski, Georgi L.; Beerwerth, Randolf; Holmes, Michael; Aldrich, Jeff; Lin, Ming-Fu; Minitti, Michael; Osipov, Timur; Schlotter, William; Cederbaum, Lorenz S.; Fritzsche, Stephan; Berrah, Nora

2018-02-01

We measured the fluorescence photon yield of neon upon soft x-ray ionization (∼1200 eV) from the x-ray free-electron laser at Linac Coherent Light Source, and demonstrated the usage of a grazing incidence spectrometer with a variable line spacing grating to perform x-ray fluorescence spectroscopy on a gas phase system. Our measurements also allowed us to estimate the focal size of the beam from the theoretical description developed, in terms of the rate equation approximation accounting for photoionization shake off of neutral neon and double auger decay of single core holes.

X-ray supermirrors for BESSY II

International Nuclear Information System (INIS)

Erko, A.; Schaefers, F.; Vidal, B.; Yakshin, A.; Pietsch, U.; Mahler, W.

1995-01-01

X-ray multilayer supermirrors for the energy range up to 20 keV have been theoretically studied and experimentally measured with synchrotron radiation. A multilayer mirror with 50 W/Si bilayers with different thicknesses on the Si substrate has a smooth reflectivity of up to 32% in the whole energy range from 5 to 22 keV at a grazing incidence angle of 0.32 degree which is considerably larger than using total external reflection. copyright 1995 American Institute of Physics

X-ray fluorescence analysis of thin films at glancing-incident and -takeoff angles

International Nuclear Information System (INIS)

Tsuji, K.; Sato, S.; Hirokawa, K.

1995-01-01

We have developed a new analytical method, Glancing-Incidence and -Takeoff X-Ray Fluorescence (GIT-XRF) method for the first time. Here, we present an idea for a thin-film analysis and a surface analysis by the GIT-XRF method. In this method, the dependence of the fluorescent x-ray intensity on takeoff angle is measured at various incident angles of the primary x-ray. Compared with a total reflection x-ray fluorescence method, the GIT-XRF method allows a detailed thin-film analysis, because the thin film is cross-checked by many experimental curves. Moreover, a surface-sensitive analysis is also possible by the GIT-XRF method. (author)

Improving x-ray fluorescence signal for benchtop polychromatic cone-beam x-ray fluorescence computed tomography by incident x-ray spectrum optimization: a Monte Carlo study.

Science.gov (United States)

Manohar, Nivedh; Jones, Bernard L; Cho, Sang Hyun

2014-10-01

To develop an accurate and comprehensive Monte Carlo (MC) model of an experimental benchtop polychromatic cone-beam x-ray fluorescence computed tomography (XFCT) setup and apply this MC model to optimize incident x-ray spectrum for improving production/detection of x-ray fluorescence photons from gold nanoparticles (GNPs). A detailed MC model, based on an experimental XFCT system, was created using the Monte Carlo N-Particle (MCNP) transport code. The model was validated by comparing MC results including x-ray fluorescence (XRF) and scatter photon spectra with measured data obtained under identical conditions using 105 kVp cone-beam x-rays filtered by either 1 mm of lead (Pb) or 0.9 mm of tin (Sn). After validation, the model was used to investigate the effects of additional filtration of the incident beam with Pb and Sn. Supplementary incident x-ray spectra, representing heavier filtration (Pb: 2 and 3 mm; Sn: 1, 2, and 3 mm) were computationally generated and used with the model to obtain XRF/scatter spectra. Quasimonochromatic incident x-ray spectra (81, 85, 90, 95, and 100 keV with 10 keV full width at half maximum) were also investigated to determine the ideal energy for distinguishing gold XRF signal from the scatter background. Fluorescence signal-to-dose ratio (FSDR) and fluorescence-normalized scan time (FNST) were used as metrics to assess results. Calculated XRF/scatter spectra for 1-mm Pb and 0.9-mm Sn filters matched (r ≥ 0.996) experimental measurements. Calculated spectra representing additional filtration for both filter materials showed that the spectral hardening improved the FSDR at the expense of requiring a much longer FNST. In general, using Sn instead of Pb, at a given filter thickness, allowed an increase of up to 20% in FSDR, more prominent gold XRF peaks, and up to an order of magnitude decrease in FNST. Simulations using quasimonochromatic spectra suggested that increasing source x-ray energy, in the investigated range of 81-100 ke

A structural view of Pd model catalysts : high-pressure surface X-Ray diffraction

NARCIS (Netherlands)

Rijn, Richard van

2012-01-01

This thesis describes the development of a combined high-pressure/ultrahigh-vacuum flow reactor for the study of model catalysts by means of surface x-ray diffraction and grazing incidence small angle scattering. The system was used to measure a stability diagram for the different oxide phases

Si(Li) detector system for application to x-ray astronomy rocket experiments

International Nuclear Information System (INIS)

Griffiths, R.E.; Cheron, C.; Friant, A.; Jehanno, C.; Rocchia, R.; Rothenflug, R.; Testard, O.

1975-01-01

The problems associated with the use of Si(Li) detectors in x-ray astronomy rocket experiments are discussed. In particular a detector system is described that can be used at the focus of a grazing-incidence paraboloid telescope for the energy range 0.3 to 2 keV. (U.S.)

High efficiency spectro graphs for the EUV and soft x-rays

International Nuclear Information System (INIS)

Cash, W.

1983-01-01

A basic need of modern UV and x-ray astronomy is the capability to perform high resolution spectroscopy of faint stars. The use of modern grazing incidence optics can be coupled to high blaze angle reflection gratings used in the conical diffraction mount to offer a versatile, efficient approach to the design problem. The authors discuss two designs of interest: an echelle spectrograph for use longward of 100 A, and an Objective Reflection Grating Spectrograph for use in the soft x-rays. General design considerations and measurements of grating efficiencies are also presented

The influence of the oblique incident X-ray that affected the image quality of the X-ray CCD sensor

International Nuclear Information System (INIS)

Suzuki, Yosuke; Matsumoto, Nobue; Morita, Hiroshi; Ohkawa, Hiromitsu

1998-01-01

The influence of the oblique incident X-ray that affected the image quality of the X-ray CCD sensor was examined and its correction was investigated. CDR was adopted in this study and evaluated image quality, by measuring MTF. The oblique projection was clinically permissible to about an oblique incident angle of 40 degrees although it exerts an influence on the magnifying power and density. The estimation of the oblique entrance direction and oblique incident angle was possible, by developing an oblique incident correction marker. When an oblique incident angle of θ degrees was measured, a correction is possible, by compressing the image cos (θ) times perpendicular to the rotational axis of CCD sensor. There was small decline of MTF, in the image where a correction for the influence of oblique incidence was made. By observation of the digital subtracted picture of the image after correction of oblique projection and that of normal, the resemblance in the two images indicated that this correction method was reasonable. (author)

The X-ray emission spectrum of gaseous acetylene

International Nuclear Information System (INIS)

Brammer, R.; Rubensson, J.E.; Wassdahl, N.; Nordgren, J.

1987-01-01

The X-ray emission spectrum of acetylene in the gas phase has been recorded using a 10 m grazing incidence spectrometer. Analysis of the spectrum is made based on calculations of total energies, potential curves and Franck-Condon vibrational intensities. Four emission bands are seen with the 1 π u band exhibiting vibrational structure. Analysis of the vibrations gives the CIs ionization energy. High energy satellite structure is observed and interpreted. (orig.)

Development of glancing-incidence and glancing-take-off X-ray fluorescence apparatus for surface and thin-film analyses

International Nuclear Information System (INIS)

Tsuji, Kouichi; Wagatsuma, Kazuaki; Yamada, Takashi; Utaka, Tadashi

1997-01-01

We have studied X-ray fluorescence analysis under glancing incidence and glancing take-off conditions. Recently, we have developed a third apparatus for detecting glancing-incidence and take-off X-ray fluorescence, which makes it possible to measure the incident-angle dependence, the take-off-angle dependence. X-ray reflectivity, and X-ray diffraction. Primarily, we have measured the take-off angular dependence of X-ray fluorescence using this apparatus. Glancing take-off X-ray fluorescence has some advantages in comparison with glancing-incidence X-ray fluorescence. The surface density and the absolute angles were determined by analysing the take-off angle dependence of the fluorescent X-rays emitted from identical atoms with the aid of the reciprocity theorem. (Author)

Low-Energy Microfocus X-Ray Source for Enhanced Testing Capability in the Stray Light Facility

Science.gov (United States)

Gaskin, Jessica; O'Dell, Stephen; Kolodziejczak, Jeff

2015-01-01

Research toward high-resolution, soft x-ray optics (mirrors and gratings) necessary for the next generation large x-ray observatories requires x-ray testing using a low-energy x-ray source with fine angular size (energy microfocus (approximately 0.1 mm spot) x-ray source from TruFocus Corporation that mates directly to the Stray Light Facility (SLF). MSFC X-ray Astronomy team members are internationally recognized for their expertise in the development, fabrication, and testing of grazing-incidence optics for x-ray telescopes. One of the key MSFC facilities for testing novel x-ray instrumentation is the SLF. This facility is an approximately 100-m-long beam line equipped with multiple x-ray sources and detectors. This new source adds to the already robust compliment of instrumentation, allowing MSFC to support additional internal and community x-ray testing needs.

First set of gated x-ray imaging diagnostics for the Laser Megajoule facility

Energy Technology Data Exchange (ETDEWEB)

Rosch, R.; Trosseille, C.; Caillaud, T.; Allouche, V.; Bourgade, J. L.; Briat, M.; Brunel, P.; Burillo, M.; Casner, A.; Depierreux, S.; Gontier, D.; Jadaud, J. P.; Le Breton, J. P.; Llavador, P.; Loupias, B.; Miquel, J. L.; Oudot, G.; Perez, S.; Raimbourg, J.; Rousseau, A. [CEA-DAM Ile de France, Bruyères-le-Châtel, 91297 Arpajon Cedex (France); and others

2016-03-15

The Laser Megajoule (LMJ) facility located at CEA/CESTA started to operate in the early 2014 with two quadruplets (20 kJ at 351 nm) focused on target for the first experimental campaign. We present here the first set of gated x-ray imaging (GXI) diagnostics implemented on LMJ since mid-2014. This set consists of two imaging diagnostics with spatial, temporal, and broadband spectral resolution. These diagnostics will give basic measurements, during the entire life of the facility, such as position, structure, and balance of beams, but they will also be used to characterize gas filled target implosion symmetry and timing, to study x-ray radiography and hydrodynamic instabilities. The design requires a vulnerability approach, because components will operate in a harsh environment induced by neutron fluxes, gamma rays, debris, and shrapnel. Grazing incidence x-ray microscopes are fielded as far as possible away from the target to minimize potential damage and signal noise due to these sources. These imaging diagnostics incorporate microscopes with large source-to-optic distance and large size gated microchannel plate detectors. Microscopes include optics with grazing incidence mirrors, pinholes, and refractive lenses. Spatial, temporal, and spectral performances have been measured on x-ray tubes and UV lasers at CEA-DIF and at Physikalisch-Technische Bundesanstalt BESSY II synchrotron prior to be set on LMJ. GXI-1 and GXI-2 designs, metrology, and first experiments on LMJ are presented here.

Flat-response x-ray-diode-detector development

International Nuclear Information System (INIS)

Tirsell, G.

1982-10-01

In this report we discuss the design of an improved sub-nanosecond flat response x-ray diode detector needed for ICF diagnostics. This device consists of a high Z cathode and a complex filter tailored to flatten the response so that the total x-ray energy below 1.5 keV can be measured using a single detector. Three major problems have become evident as a result of our work with the original LLNL design including deviation from flatness due to a peak in the response below 200 eV, saturation at relatively low x-ray fluences, and long term gold cathode instability. We are investigating grazing incidence reflection to reduce the response below 200 eV, new high Z cathode materials for long term stability, and a new complex filter for improved flatness. Better saturation performance will require a modified XRD detector under development with reduced anode to cathode spacing and increased anode bias voltage

W/SiC X-ray multilayers optimized for use above 100 keV

DEFF Research Database (Denmark)

Windt, D.L.; Dongey, S.; Hailey, C.J.

2002-01-01

-derived optical constants, which we determined from reflectance-vs-incidence angle measurements also made using synchrotron radiation, in the range E=120 - 180 keV. We describe our experimental investigation in detail, compare the new W/SiC multilayers with both W/Si and W/B4C films that have been studied......We have developed a new depth-graded multilayer system comprising W and SiC layers, suitable for use as hard X-ray reflective coatings operating in the energy range 100 - 200 keV. Grazing incidence X-ray reflectance at E=8 keV was used to characterize the interface widths, as well as the temporal...... and thermal stability in both periodic and depth-graded W/SiC structures, while synchrotron radiation was used to measure the hard X-ray reflectance of a depth-graded multilayer designed specifically for use in the range Esimilar to150 - 170 keV. We have modeled the hard X-ray reflectance using newly...

W/SiC x-ray multilayers optimized for use above 100 keV

DEFF Research Database (Denmark)

Windt, D.L.; Donguy, S.; Hailey, C.J.

2003-01-01

optical constants, which we determined from reflectance versus incidence angle measurements also made using synchrotron radiation, in the range E = 120-180 keV. We describe our experimental investigation in detail, compare the new W/SiC multilayers with both W/Si and W/B4C films that have been studied......We have developed a new depth-graded multilayer system comprising W and SiC layers, suitable for use as hard x-ray reflective coatings operating in the energy range 100-200 keV. Grazing-incidence x-ray reflectance at E = 8 keV was used to characterize the interface widths, as well as the temporal...... and thermal stability in both periodic and depth-graded W/SiC structures, whereas synchrotron radiation was used to measure the hard x-ray reflectance of a depth-graded multilayer designed specifically for use in, the range Esimilar to150-170 keV. We have modeled the hard x-ray reflectance using newly derived...

An introduction to the water recovery x-ray rocket

Science.gov (United States)

Miles, Drew M.; McEntaffer, Randall L.; Schultz, Ted B.; Donovan, Benjamin D.; Tutt, James H.; Yastishock, Daniel; Steiner, Tyler; Hillman, Christopher R.; McCoy, Jake A.; Wages, Mitchell; Hull, Sam; Falcone, Abe; Burrows, David N.; Chattopadhyay, Tanmoy; Anderson, Tyler; McQuaide, Maria

2017-08-01

The Water Recovery X-ray Rocket (WRXR) is a sounding rocket payload that will launch from the Kwajalein Atoll in April 2018 and seeks to be the first astrophysics sounding rocket payload to be water recovered by NASA. WRXR's primary instrument is a grating spectrometer that consists of a mechanical collimator, X-ray reflection gratings, grazing-incidence mirrors, and a hybrid CMOS detector. The instrument will obtain a spectrum of the diffuse soft X-ray emission from the northern part of the Vela supernova remnant and is optimized for 3rd and 4th order OVII emission. Utilizing a field of view of 3.25° × 3.25° and resolving power of λ/δλ ≍40-50 in the lines of interest, the WRXR spectrometer aims to achieve the most highly-resolved spectrum of Vela's diffuse soft X-ray emission. This paper presents introductions to the payload and the science target.

In situ electrochemical impedance spectroscopy/synchrotron radiation grazing incidence X-ray diffraction-A powerful new technique for the characterization of electrochemical surfaces and interfaces

Energy Technology Data Exchange (ETDEWEB)

De Marco, Roland [Nanochemistry Research Institute, Department of Applied Chemistry, Curtin University of Technology, GPO Box U 1987, Perth, WA 6845 (Australia)]. E-mail: r.demarco@exchange.curtin.edu.au; Jiang, Z.-T. [Nanochemistry Research Institute, Department of Applied Chemistry, Curtin University of Technology, GPO Box U 1987, Perth, WA 6845 (Australia); Martizano, Jay [Nanochemistry Research Institute, Department of Applied Chemistry, Curtin University of Technology, GPO Box U 1987, Perth, WA 6845 (Australia); Lowe, Alex [Nanochemistry Research Institute, Department of Applied Chemistry, Curtin University of Technology, GPO Box U 1987, Perth, WA 6845 (Australia); Pejcic, Bobby [Nanochemistry Research Institute, Department of Applied Chemistry, Curtin University of Technology, GPO Box U 1987, Perth, WA 6845 (Australia); Riessen, Arie van [Materials Research Group, Department of Applied Physics, Curtin University of Technology, GPO Box U 1987, Perth, WA 6845 (Australia)

2006-08-15

A marriage of electrochemical impedance spectroscopy (EIS) and in situ synchrotron radiation grazing incidence X-ray diffraction (SR-GIXRD) has provided a powerful new technique for the elucidation of the mechanistic chemistry of electrochemical systems. In this study, EIS/SR-GIXRD has been used to investigate the influence of metal ion buffer calibration ligands, along with natural organic ligands in seawater, on the behaviour of the iron chalcogenide glass ion-selective electrode (ISE). The SR-GIXRD data demonstrated that citrate - a previously reported poor iron calibration ligand for the analysis of seawater - induced an instantaneous and total dissolution of crystalline GeSe and Sb{sub 2}Se{sub 3} in the modified surface layer (MSL) of the ISE, while natural organic ligands in seawater and a mixture of ligands in a mimetic seawater ligand system protected the MSL's crystalline inclusions of GeSe and Sb{sub 2}Se{sub 3} from oxidative attack. Expectedly, the EIS data showed that citrate induced a loss in the medium frequency time constant for the MSL of the ISE, while seawater's natural organic ligands and the mimetic ligand system preserved the medium frequency EIS response characteristics of the ISE's MSL. The new EIS/SR-GIXRD technique has provided insights into the suitability of iron calibration ligands for the analysis of iron in seawater.

Aplanatic grazing incidence diffraction grating: a new optical element

International Nuclear Information System (INIS)

Hettrick, M.C.

1986-01-01

We present the theory of a grazing incidence reflection grating capable of imaging at submicron resolution. The optic is mechanically ruled on a spherical or cylindrical surface with varied groove spacings, delivering diffraction-limited response and a wide field of view at a selected wavelength. Geometrical aberrations are calculated on the basis of Fermat's principle, revealing significant improvements over a grazing incidence mirror. Aplanatic and quasi-aplanatic versions of the grating have applications in both imaging and scanning microscopes, microprobes, collimators, and telescopes. A 2-D crossed system of such gratings, similar to the grazing incidence mirror geometry of Kirkpatrick and Baez, could potentially provide spatial resolutions of --200 A

Understanding the performance of x-ray mirrors

International Nuclear Information System (INIS)

Takacs, P.Z.

1989-01-01

The manufacture of x-ray mirrors is a rather specialized branch of the optical fabrication industry. As those who have had to deal with the procurement of these components well know, there are only a handful of optical companies who supply most of the grazing incidence optics in use at the synchrotron light source facilities in this country. There is relatively little information available of practical use to guide the user through any of the above steps. We have been ''forced'' to develop our own foundation for assessing the performance of various vendors and determining the quality of the components produced by them. Our approach has been to concentrate on the area of metrology of grazing incidence optics and to develop instruments and techniques that can be used to improve the quality of components delivered to us. The major problem hindering the production of grazing incidence optics is the lack of specialized metrology instrumentation that can be used by the small manufacturing shop to assess the quality of the component under production. We have been engaged over the past several years in developing the theoretical framework and practical measurement techniques to link the metrology to actual performance, providing much-needed feedback to the manufacture and also educating users and manufacturers in the proper understanding of the language of surface figure and finish metrology

A broad band X-ray imaging spectrophotometer for astrophysical studies

Science.gov (United States)

Lum, Kenneth S. K.; Lee, Dong Hwan; Ku, William H.-M.

1988-01-01

A broadband X-ray imaging spectrophotometer (BBXRIS) has been built for astrophysical studies. The BBXRIS is based on a large-imaging gas scintillation proportional counter (LIGSPC), a combination of a gas scintillation proportional counter and a multiwire proportional counter, which achieves 8 percent (FWHM) energy resolution and 1.5-mm (FWHM) spatial resolution at 5.9 keV. The LIGSPC can be integrated with a grazing incidence mirror and a coded aperture mask to provide imaging over a broad range of X-ray energies. The results of tests involving the LIGSPC and a coded aperture mask are presented, and possible applications of the BBXRIS are discussed.

High reflectance Cr/C multilayer at 250 eV for soft X-ray polarimetry

Energy Technology Data Exchange (ETDEWEB)

Wen, Mingwu; Jiang, Li; Zhang, Zhong; Huang, Qiushi [MOE Key Laboratory of Advanced Micro-Structured Materials, Institute of Precision Optical Engineering (IPOE), School of Physics Science and Engineering, Tongji University, Shanghai 200092 (China); Wang, Zhanshan, E-mail: wangzs@tongji.edu.cn [MOE Key Laboratory of Advanced Micro-Structured Materials, Institute of Precision Optical Engineering (IPOE), School of Physics Science and Engineering, Tongji University, Shanghai 200092 (China); She, Rui; Feng, Hua [Department of Engineering Physics, Tsinghua University, Beijing (China); Wang, Hongchang [Diamond Light Source, Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE (United Kingdom)

2015-10-01

X-ray reflection near 45° via multilayer mirrors can be used for astronomical polarization measurements. A Cr/C multilayer mirror (designed for X-ray polarimetry at 250 eV), with a period thickness of 3.86 nm and a bi-layer number of 100, was fabricated using direct current magnetron sputtering. Grazing incidence X-ray reflectometry at 8 keV and transmission electron microscopy were used to investigate the multilayer structure. Different models were introduced to fit the hard X-ray reflectivity curve, which indicates that the layer thickness of two materials slightly drifts from the bottom to the top of the stack. Both the chromium and carbon layers are amorphous with asymmetric interfaces, while the Cr-on-C interface is slightly wider. Based on the good quality of the multilayer structure, a high reflectivity of 21.8% for the s-polarized light was obtained at 250 eV at a grazing incidence angle of 40.7°. The fabricated Cr/C multilayer mirror exhibits high reflectivity and polarization levels in the energy region of 240 eV–260 eV. - Highlights: • We fabricated Cr/C multilayer with 3.8 nm d-spacing. • X-ray reflectometry was used to determine the exact structure of Cr/C multilayer. • A high reflectivity of 21.8% for the s-polarized light was obtained at 250 eV. • Both Cr and C were found to be amorphous with slightly asymmetric interfaces. • A 4-layer model was used to fit and explain the results.

Lasers, extreme UV and soft X-ray

Energy Technology Data Exchange (ETDEWEB)

Nilsen, Joseph [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)

2015-09-20

Three decades ago, large ICF lasers that occupied entire buildings were used as the energy sources to drive the first X-ray lasers. Today X-ray lasers are tabletop, spatially coherent, high-repetition rate lasers that enable many of the standard optical techniques such as interferometry to be extended to the soft X-ray regime between wavelengths of 10 and 50 nm. Over the last decade X-ray laser performance has been improved by the use of the grazing incidence geometry, diode-pumped solid-state lasers, and seeding techniques. The dominant X-ray laser schemes are the monopole collisional excitation lasers either driven by chirped pulse amplification (CPA) laser systems or capillary discharge. The CPA systems drive lasing in neon-like or nickel-like ions, typically in the 10 – 30 nm range, while the capillary system works best for neon-like argon at 46.9 nm. Most researchers use nickel-like ion lasers near 14 nm because they are well matched to the Mo:Si multilayer mirrors that have peak reflectivity near 13 nm and are used in many applications. As a result, the last decade has seen the birth of the X-ray free electron laser (XFEL) that can reach wavelengths down to 0.15 nm and the inner-shell Ne laser at 1.46 nm.

The role of surface topography in predicting scattering at grazing incidence from optical surfaces

International Nuclear Information System (INIS)

Rehn, V.; Jones, V.O.; Elson, J.M.; Bennett, J.M.

1980-01-01

Monochromator design and the design of optical experiments at XUV and X-ray wavelengths are frequently limited by scattering from optical components, yet theoretical treatments are few and untested experimentally. This is partly due to the failure of scattering models used in the visible and near UV when the wavelength becomes comparable to, or smaller than, the topographic features on the surface, and partly it is due to the difficulty in measuring the topography on the required size scale. We briefly review the theoretical problems and prospects for accurately predicting both the magnitude and angular distribution of scattering at grazing incidence from optical surfaces. Experimental methods for determining and representing the surface topography are also reviewed, together with their limitations and ranges of applicability. Finally, the first results of our experiments, conducted recently at the Stanford Synchrotron Radiation Laboratory on the angular distribution of scattering by surfaces of known topography are presented and discussed, along with their potential implications for the theory of scattering, and for XUV and X-ray optical components. (orig.)

Applications of synchrotron X-rays in microelectronics industry research

International Nuclear Information System (INIS)

Jordan-Sweet, Jean L.; Detavernier, Christophe; Lavoie, Christian; Mooney, Patricia M.; Toney, Michael F.

2005-01-01

The high flux and density of X-rays produced at synchrotrons provide the microelectronics industry with a powerful probe of the structure and behavior of a wide array of solid materials that are being developed for use in devices of the future. They also are of great use in determining why currently-used materials and processes sometimes fail. This paper describes the X20 X-ray beamline facility operated by IBM at the National Synchrotron Light Source, and presents a series of three industry challenges and results that illustrate the variety of techniques used and problems addressed. The value of this research ranges from solving short-term, technically specific problems to increasing our academic understanding of materials in general. Techniques discussed include high-resolution diffraction, time-resolved diffraction, texture measurements, and grazing-incidence diffraction

Phase transitions in diglyceride monolayers studied by computer simulations, pressure-area isotherms and x-ray diffraction

DEFF Research Database (Denmark)

Peters, Günther H.J.; Toxværd, S.; Larsen, N.B.

1994-01-01

1,2-sn-diglyceride monolayers exhibit unique and complex phase transitions as a function of surface pressure. The dynamical response of the layer on expanding the film has been investigated by computer simulations, (π-A) isotherms and grazing-incidence X-ray diffraction. Good agreement is found b...

X-ray determination of charge states of ions moving in solids

International Nuclear Information System (INIS)

Fortner, R.J.; Matthews, D.L.

1974-02-01

The first part of this work discusses previous measurements of x-ray spectra and thick-target yields for Ar ions moving in solid graphite targets. These data are strongly affected by ''solid target effects.'' There are some rather serious limitations in the above measurements. This proposal solicits funds to expand the program to eliminate the limitations. The second part of the proposal contains a more detailed presentation of three types of measurements. These involve the extension of work to other collision systems, the development of an Auger electron spectrometer, and the use of a 7-m grazing-incidence spectrograph for x-ray spectroscopy. These measurements will enable testing of current pictures describing ions moving in solids and shed light on the feasibility of producing a beam of ions which could give rise to amplified stimulated x-ray emission (x-ray laser). (11 figures) (U.S.)

Development of a multi-lane X-ray mirror providing variable beam sizes

Energy Technology Data Exchange (ETDEWEB)

Laundy, D., E-mail: david.laundy@diamond.ac.uk; Sawhney, K.; Nistea, I.; Alcock, S. G.; Pape, I.; Sutter, J.; Alianelli, L.; Evans, G. [Diamond Light Source Ltd., Harwell Science and Innovation Campus, Didcot OX11 0DE (United Kingdom)

2016-05-15

Grazing incidence mirrors are used on most X-ray synchrotron beamlines to focus, collimate or suppress harmonics. Increasingly beamline users are demanding variable beam shapes and sizes at the sample position. We have now developed a new concept to rapidly vary the beam size and shape of a focused X-ray beam. The surface of an elliptically figured mirror is divided into a number of laterally separated lanes, each of which is given an additional longitudinal height profile calculated to shape the X-ray beam to a top-hat profile in the focal plane. We have now fabricated two prototype mirrors and present the results of metrology tests and measurements made with one of the mirrors focusing the X-rays on a synchrotron beamline. We envisage that such mirrors could be widely applied to rapid beam-size switching on many synchrotron beamlines.

High resolution krypton M/sub 4,5/ x-ray emission spectra

International Nuclear Information System (INIS)

Perera, R.C.C.; Hettrick, M.C.; Lindle, D.W.

1987-10-01

High resolution M/sub 4,5/ (3d → 4p) x-ray emission spectra from a krypton plasma were measured using a recently developed grazing-incidence reflection-grating monochromator/spectrometer with very high flux rates at extreme ultraviolet and soft x-ray wave lengths. The nominal resolving power of the instrument, E/ΔE, is about 300 in this energy range (∼80 eV). Three dipole-allowed 3d → 4p emission lines were observed at 80.98 eV, 80.35 eV and 79.73 eV. A broad peak at about 82.3 eV is tentatively assigned to transitions resulting from Kr 2+ , and effects of excitation energy on M/sub 4,5/ x-ray emission were observed. 9 refs., 3 figs., 1 tab

DynamiX, numerical tool for design of next-generation x-ray telescopes.

Science.gov (United States)

Chauvin, Maxime; Roques, Jean-Pierre

2010-07-20

We present a new code aimed at the simulation of grazing-incidence x-ray telescopes subject to deformations and demonstrate its ability with two test cases: the Simbol-X and the International X-ray Observatory (IXO) missions. The code, based on Monte Carlo ray tracing, computes the full photon trajectories up to the detector plane, accounting for the x-ray interactions and for the telescope motion and deformation. The simulation produces images and spectra for any telescope configuration using Wolter I mirrors and semiconductor detectors. This numerical tool allows us to study the telescope performance in terms of angular resolution, effective area, and detector efficiency, accounting for the telescope behavior. We have implemented an image reconstruction method based on the measurement of the detector drifts by an optical sensor metrology. Using an accurate metrology, this method allows us to recover the loss of angular resolution induced by the telescope instability. In the framework of the Simbol-X mission, this code was used to study the impacts of the parameters on the telescope performance. In this paper we present detailed performance analysis of Simbol-X, taking into account the satellite motions and the image reconstruction. To illustrate the versatility of the code, we present an additional performance analysis with a particular configuration of IXO.

DynamiX, numerical tool for design of next-generation x-ray telescopes

International Nuclear Information System (INIS)

Chauvin, Maxime; Roques, Jean-Pierre

2010-01-01

We present a new code aimed at the simulation of grazing-incidence x-ray telescopes subject to deformations and demonstrate its ability with two test cases: the Simbol-X and the International X-ray Observatory (IXO) missions. The code, based on Monte Carlo ray tracing, computes the full photon trajectories up to the detector plane, accounting for the x-ray interactions and for the telescope motion and deformation. The simulation produces images and spectra for any telescope configuration using Wolter I mirrors and semiconductor detectors. This numerical tool allows us to study the telescope performance in terms of angular resolution, effective area, and detector efficiency, accounting for the telescope behavior. We have implemented an image reconstruction method based on the measurement of the detector drifts by an optical sensor metrology. Using an accurate metrology, this method allows us to recover the loss of angular resolution induced by the telescope instability. In the framework of the Simbol-X mission, this code was used to study the impacts of the parameters on the telescope performance. In this paper we present detailed performance analysis of Simbol-X, taking into account the satellite motions and the image reconstruction. To illustrate the versatility of the code, we present an additional performance analysis with a particular configuration of IXO.

DynamiX, numerical tool for design of next-generation x-ray telescopes

Energy Technology Data Exchange (ETDEWEB)

Chauvin, Maxime; Roques, Jean-Pierre

2010-07-20

We present a new code aimed at the simulation of grazing-incidence x-ray telescopes subject to deformations and demonstrate its ability with two test cases: the Simbol-X and the International X-ray Observatory (IXO) missions. The code, based on Monte Carlo ray tracing, computes the full photon trajectories up to the detector plane, accounting for the x-ray interactions and for the telescope motion and deformation. The simulation produces images and spectra for any telescope configuration using Wolter I mirrors and semiconductor detectors. This numerical tool allows us to study the telescope performance in terms of angular resolution, effective area, and detector efficiency, accounting for the telescope behavior. We have implemented an image reconstruction method based on the measurement of the detector drifts by an optical sensor metrology. Using an accurate metrology, this method allows us to recover the loss of angular resolution induced by the telescope instability. In the framework of the Simbol-X mission, this code was used to study the impacts of the parameters on the telescope performance. In this paper we present detailed performance analysis of Simbol-X, taking into account the satellite motions and the image reconstruction. To illustrate the versatility of the code, we present an additional performance analysis with a particular configuration of IXO.

Relationship between electrical properties and crystallization of indium oxide thin films using ex-situ grazing-incidence wide-angle x-ray scattering

Science.gov (United States)

González, G. B.; Okasinski, J. S.; Buchholz, D. B.; Boesso, J.; Almer, J. D.; Zeng, L.; Bedzyk, M. J.; Chang, R. P. H.

2017-05-01

Grazing-incidence, wide-angle x-ray scattering measurements were conducted on indium oxide thin films grown on silica substrates via pulsed laser deposition. Growth temperatures (TG) in this study ranged from -50 °C to 600 °C, in order to investigate the thermal effects on the film structure and its spatial homogeneity, as well as their relationship to electrical properties. Films grown below room temperature were amorphous, while films prepared at TG = 25 °C and above crystallized in the cubic bixbyite structure, and their crystalline fraction increased with deposition temperature. The electrical conductivity (σ) and electrical mobility (μ) were strongly enhanced at low deposition temperatures. For TG = 25 °C and 50 °C, a strong ⟨100⟩ preferred orientation (texture) occurred, but it decreased as the deposition temperature, and consequential crystallinity, increased. Higher variations in texture coefficients and in lattice parameters were measured at the film surface compared to the interior of the film, indicating strong microstructural gradients. At low crystallinity, the in-plane lattice spacing expanded, while the out-of-plane spacing contracted, and those values merged at TG = 400 °C, where high μ was measured. This directional difference in lattice spacing, or deviatoric strain, was linear as a function of both deposition temperature and the degree of crystallinity. The crystalline sample with TG = 100 °C had the lowest mobility, as well as film diffraction peaks which split into doublets. The deviatoric strains from these doublet peaks differ by a factor of four, supporting the presence of both a microstructure and strain gradient in this film. More isotropic films exhibit larger μ values, indicating that the microstructure directly correlates with electrical properties. These results provide valuable insights that can help to improve the desirable properties of indium oxide, as well as other transparent conducting oxides.

Effects of oxygen partial pressure and annealing temperature on the residual stress of hafnium oxide thin-films on silicon using synchrotron-based grazing incidence X-ray diffraction

Energy Technology Data Exchange (ETDEWEB)

Biswas, Debaleen [Saha Institute of Nuclear Physics, 1/AF Bidhannagar, Kolkata 700 064 (India); Sinha, Anil Kumar [ISU, Raja Ramanna Centre for Advanced Technology, Indore 452 013 (India); Homi Bhabha National Institute, BARC, Mumbai 400 094 (India); Chakraborty, Supratic, E-mail: supratic.chakraborty@saha.ac.in [Saha Institute of Nuclear Physics, 1/AF Bidhannagar, Kolkata 700 064 (India)

2016-10-30

Highlights: • Residual stress estimation thin hafnium oxide film with thickness of <10 nm. • A mathematical expression is proposed for stress estimation of thin-film using GIXRD. • Residual stress varies with argon content in Ar/O{sub 2} plasma and annealing temperature. • Variation of stress is explained by IL swelling and enhanced structural relaxation. - Abstract: Synchrotron radiation-based grazing incidence X-ray diffraction (GI-XRD) technique is employed here to estimate the residual stress of < 10 nm thin hafnium oxide film deposited on Si (100) substrate at different argon/oxygen ratios using reactive rf sputtering. A decrease in residual stress, tensile in nature, is observed at higher annealing temperature for the samples deposited with increasing argon ratio in the Ar/O{sub 2} plasma. The residual stress of the films deposited at higher p{sub Ar} (Ar:O{sub 2} = 4:1) is also found to be decreased with increasing annealing temperature. But the stress is more or less constant with annealing temperature for the films deposited at lower Ar/O{sub 2} (1:4) ratio. All the above phenomena can be explained on the basis of swelling of the interfacial layer and enhanced structural relaxation in the presence of excess Hf in hafnium oxide film during deposition.

Parameter study of self-absorption effects in Total Reflection X-ray Fluorescence-X-ray Absorption Near Edge Structure analysis of arsenic

International Nuclear Information System (INIS)

Meirer, F.; Pepponi, G.; Streli, C.; Wobrauschek, P.; Kregsamer, P.; Zoeger, N.; Falkenberg, G.

2008-01-01

Total reflection X-ray Fluorescence (TXRF) analysis in combination with X-ray Absorption Near Edge Structure (XANES) analysis is a powerful method to perform chemical speciation studies at trace element levels. However, when measuring samples with higher concentrations and in particular standards, damping of the oscillations is observed. In this study the influence of self-absorption effects on TXRF-XANES measurements was investigated by comparing measurements with theoretical calculations. As(V) standard solutions were prepared at various concentrations and dried on flat substrates. The measurements showed a correlation between the damping of the oscillations and the As mass deposited. A Monte-Carlo simulation was developed using data of the samples shapes obtained from confocal white light microscopy. The results showed good agreement with the measurements; they confirmed that the key parameters are the density of the investigated atom in the dried residues and the shape of the residue, parameters that combined define the total mass crossed by a certain portion of the incident beam. The study presents a simple approach for an a priori evaluation of the self-absorption in TXRF X-ray absorption studies. The consequences for Extended X-ray Absorption Fine Structure (EXAFS) and XANES measurements under grazing incidence conditions are discussed, leading to the conclusion that the damping of the oscillations seems to make EXAFS of concentrated samples non feasible. For XANES 'fingerprint' analysis samples should be prepared with a deposited mass and sample shape leading to an acceptable absorption for the actual investigation

CARNAÚBA: The Coherent X-Ray Nanoprobe Beamline for the Brazilian Synchrotron SIRIUS/LNLS

Science.gov (United States)

Tolentino, Hélio C. N.; Soares, Márcio M.; Perez, Carlos A.; Vicentin, Flávio C.; Abdala, Dalton B.; Galante, Douglas; Teixeira, Verônica de C.; de Araújo, Douglas H. C.; Westfahl, Harry, Jr.

2017-06-01

The CARNAÚBA beamline is the tender-to-hard X-ray (2 - 15 keV) scanning nanoprobe planned for the 4th generation storage ring SIRIUS at the LNLS. CARNAÚBA uses an undulator source with vertical linear polarization in a low-beta straight section and grazing incidence-focusing mirrors to create a nanoprobe at 143 m from the source. The beamline optic is based on KB mirrors and provides high brilliance at an achromatic focal spot down to the diffraction limit diameter of ˜30 nm with a working distance of ˜6 cm. These characteristics are crucial for studying nanometric samples in experiments involving complex stages and environments. The CARNAÚBA beamline aims to perform raster scans using x-ray fluorescence, x-ray absorption spectroscopy, x-ray diffraction and coherent x-ray imaging techniques. Computed tomography will extend these methods to three dimensions.

Oblique incidence effects in direct x-ray detectors: A first-order approximation using a physics-based analytical model

International Nuclear Information System (INIS)

Badano, Aldo; Freed, Melanie; Fang Yuan

2011-01-01

Purpose: The authors describe the modifications to a previously developed analytical model of indirect CsI:Tl-based detector response required for studying oblique x-ray incidence effects in direct semiconductor-based detectors. This first-order approximation analysis allows the authors to describe the associated degradation in resolution in direct detectors and compare the predictions to the published data for indirect detectors. Methods: The proposed model is based on a physics-based analytical description developed by Freed et al. [''A fast, angle-dependent, analytical model of CsI detector response for optimization of 3D x-ray breast imaging systems,'' Med. Phys. 37(6), 2593-2605 (2010)] that describes detector response functions for indirect detectors and oblique incident x rays. The model, modified in this work to address direct detector response, describes the dependence of the response with x-ray energy, thickness of the transducer layer, and the depth-dependent blur and collection efficiency. Results: The authors report the detector response functions for indirect and direct detector models for typical thicknesses utilized in clinical systems for full-field digital mammography (150 μm for indirect CsI:Tl and 200 μm for a-Se direct detectors). The results suggest that the oblique incidence effect in a semiconductor detector differs from that in indirect detectors in two ways: The direct detector model produces a sharper overall PRF compared to the response corresponding to the indirect detector model for normal x-ray incidence and a larger relative increase in blur along the x-ray incidence direction compared to that found in indirect detectors with respect to the response at normal incidence angles. Conclusions: Compared to the effect seen in indirect detectors, the direct detector model exhibits a sharper response at normal x-ray incidence and a larger relative increase in blur along the x-ray incidence direction with respect to the blur in the

Synthesis of Novel Amphiphilic Azobenzenes and X-ray Scattering Studies of Their Langmuir Monolayers

DEFF Research Database (Denmark)

Sørensen, Thomas Just; Kjær, Kristian; Breiby, Dag Werner

2008-01-01

. At the air-water interface, the amphiphilic azobenzenes form noncrystalline but stable Langmuir films that display an unusual reversible monolayer collapse close to 35 mN/m. The structures and phase transitions were studied by X-ray reflectivity (XR) and grazing-incidence X-ray diffraction, both utilizing...... synchrotron radiation. Compression beyond the collapse point does not change the XR data, showing that the film is unchanged at the molecular level, even at areas less than half of that of the collapse. This leads to the conclusion that few macroscopic collapse sites are responsible for reversibly removing...

Calibration of the Verification Engineering Test Article-I (VETA-I) for AXAF using the VETA-I X-ray Detection System

Science.gov (United States)

Kellogg, E.; Brissenden, R.; Flanagan, K.; Freeman, M.; Hughes, J.; Jones, M.; Ljungberg, M.; Mckinnon, P.; Podgorski, W.; Schwartz, D.

1992-01-01

Advanced X-ray Astrophysics Facility (AXAF) X-ray optics testing is conducted by VETA-I, which consists of six nested Wolter type I grazing-incidence mirrors; VETA's X-ray Detection System (VXDS) in turn measures the imaging properties of VETA-I, yielding FWHM and encircled energy of the X-ray image obtained, as well as its effective area. VXDS contains a high resolution microchannel plate imaging X-ray detector and a pinhole scanning system in front of proportional-counter detectors. VETA-I's X-ray optics departs from the AXAF flight configuration in that it uses a temporary holding fixture; its mirror elements are not cut to final length, and are not coated with the metal film used to maximize high-energy reflection.

Portable mini-chamber for temperature dependent studies using small angle and wide angle x-ray scattering

Science.gov (United States)

Dev, Arun Singh; Kumar, Dileep; Potdar, Satish; Pandit, Pallavi; Roth, Stephan V.; Gupta, Ajay

2018-04-01

The present work describes the design and performance of a vacuum compatible portable mini chamber for temperature dependent GISAXS and GIWAXS studies of thin films and multilayer structures. The water cooled body of the chamber allows sample annealing up to 900 K using ultra high vacuum compatible (UHV) pyrolytic boron nitride heater, thus making it possible to study the temperature dependent evolution of structure and morphology of two-dimensional nanostructured materials. Due to its light weight and small size, the chamber is portable and can be accommodated at synchrotron facilities worldwide. A systematic illustration of the versatility of the chamber has been demonstrated at beamline P03, PETRA-III, DESY, Hamburg, Germany. Temperature dependent grazing incidence small angle x-ray scattering (GISAXS) and grazing incidence wide angle x-ray scattering (GIWAXS) measurements were performed on oblique angle deposited Co/Ag multilayer structure, which jointly revealed that the surface diffusion in Co columns in Co/Ag multilayer enhances by increasing temperature from RT to ˜573 K. This results in a morphology change from columnar tilted structure to densely packed morphological isotropic multilayer.

Cr/B{sub 4}C multilayer mirrors: Study of interfaces and X-ray reflectance

Energy Technology Data Exchange (ETDEWEB)

Burcklen, C.; Meltchakov, E.; Jérome, A.; Rossi, S. de; Delmotte, F. [Laboratoire Charles Fabry, Institut d' Optique Graduate School, CNRS, Université Paris-Saclay, 91127 Palaiseau Cedex (France); Soufli, R. [Laboratoire Charles Fabry, Institut d' Optique Graduate School, CNRS, Université Paris-Saclay, 91127 Palaiseau Cedex (France); Lawrence Livermore National Laboratory, 7000 East Avenue, Livermore, California 94550 (United States); Dennetiere, D.; Polack, F.; Capitanio, B.; Thomasset, M. [Synchrotron SOLEIL, L' Orme des Merisiers, Saint Aubin, BP 48F-91192 Gif sur Yvette Cedex (France); Gullikson, E. [Center for X-ray Optics, Lawrence Berkeley National Laboratory, 1 Cyclotron Rd., Berkeley, California 94720 (United States)

2016-03-28

We present an experimental study of the effect of layer interfaces on the x-ray reflectance in Cr/B{sub 4}C multilayer interference coatings with layer thicknesses ranging from 0.7 nm to 5.4 nm. The multilayers were deposited by magnetron sputtering and by ion beam sputtering. Grazing incidence x-ray reflectometry, soft x-ray reflectometry, and transmission electron microscopy reveal asymmetric multilayer structures with a larger B{sub 4}C-on-Cr interface, which we modeled with a 1–1.5 nm thick interfacial layer. Reflectance measurements in the vicinity of the Cr L{sub 2,3} absorption edge demonstrate fine structure that is not predicted by simulations using the currently tabulated refractive index (optical constants) values for Cr.

Anomalous scattering, transport, and spatial distribution of X-ray fluorescence at the exit of polycapillary structures

Energy Technology Data Exchange (ETDEWEB)

Mazuritskiy, M. I., E-mail: mazurmik@gmail.com; Lerer, A. M.; Makhno, P. V. [Southern Federal University (Russian Federation)

2016-12-15

The angular distribution of the X-ray intensity at the exit of microchannel plates at grazing incidence of monochromatic radiation on the walls of microcapillaries has been investigated. The angles and energies of the primary radiation quanta at which the synchrotron beam excites X-ray fluorescence propagating inside polycapillary structures have been determined. The angular dependences of the intensity distribution of X-rays transmitted through the microcapillaries have been studied theoretically and experimentally for energies corresponding to the region of anomalous dispersion near the L{sub 2,3} absorption edges of silicon. The propagation of waves in hollow polycapillary waveguides, the excitation of X-ray fluorescence, and the X-ray diffraction at the exit of microchannel plates have been modeled mathematically. The mathematical model takes into account the presence of a transition layer on the microchannel surface.

X-ray imagery

International Nuclear Information System (INIS)

Dhez, P.

1986-01-01

Direct projection, pin diaphragm, lenses, mirrors and holography are used for X images. Each method is examined, radiation source problem is taken in account. For instance, the important role of synchrotron radiation in direct projection is noticed (angiography, microlithography, isotope separation). The pin diaphragm is used for laser-plasma images. Two use techniques of mirrors are presented: in grazing incidence (X-UV telescopes on satellite board) or in normal incidence (new ''laminated'' mirrors). This second technique, which uses interferences, seems to be the unique solution to equip optical cavities of X lasers. More classically, the multilayered mirrors are applicated to X microscopes (with synchrotron radiation). Lenses use diffraction. They lead to scanning X microscopes. At last, reconstruction methods of image are reviewed: different from computer are topography interferometry and holography. These three last ones are precised. In conclusion, the X optics application to two-dimensional material physics is recalled [fr

Prototyping iridium coated mirrors for x-ray astronomy

Science.gov (United States)

Döhring, Thorsten; Probst, Anne-Catherine; Stollenwerk, Manfred; Emmerich, Florian; Stehlíková, Veronika; Inneman, Adolf

2017-05-01

X-ray astronomy uses space-based telescopes to overcome the disturbing absorption of the Earth's atmosphere. The telescope mirrors are operating at grazing incidence angles and are coated with thin metal films of high-Z materials to get sufficient reflectivity for the high-energy radiation to be observed. In addition the optical payload needs to be light-weighted for launcher mass constrains. Within the project JEUMICO, an acronym for "Joint European Mirror Competence", the Aschaffenburg University of Applied Sciences and the Czech Technical University in Prague started a collaboration to develop mirrors for X-ray telescopes. The X-ray telescopes currently developed within this Bavarian- Czech project are of Lobster eye type optical design. Corresponding mirror segments use substrates of flat silicon wafers which are coated with thin iridium films, as this material is promising high reflectivity in the X-ray range of interest. The deposition of the iridium films is based on a magnetron sputtering process. Sputtering with different parameters, especially by variation of the argon gas pressure, leads to iridium films with different properties. In addition to investigations of the uncoated mirror substrates the achieved surface roughness has been studied. Occasional delamination of the iridium films due to high stress levels is prevented by chromium sublayers. Thereby the sputtering parameters are optimized in the context of the expected reflectivity of the coated X-ray mirrors. In near future measurements of the assembled mirror modules optical performances are planned at an X-ray test facility.

Residual stress analysis on materials with steep stress gradient by using X-ray incidence at higher angles

International Nuclear Information System (INIS)

Ohya, Shin-ichi; Yoshioka, Yasuo; Maeno, Shigeki

1996-01-01

X-ray stress measurements for isotropic polycrystalline are materials are usually carried out by the sin 2 ψ method under the assumption of no stress gradient in X-ray penetration depth. When a steep stress gradient exists in the vicinity of surface layer, however, non-linear sin 2 ψ relation is observed and the sin 2 ψ method cannot be applied on such cases. Although several X-ray stress analyzers have been developed for materials with steep stress gradient in the surface layer, it is desirable to use diffraction data at higher incident angles of ψ 0 as possible as close on 90 degrees in order to determine the both values of surface stress and stress gradient with high accuracy. In the present study, an X-ray stress analyzer based on Ω geometry was fabricated to enable X-ray incidence at higher angle of ψ 0 . The X-ray detector was positioned on -η side against X-ray incident beam. Both of the residual surface stress and stress gradient were determined by use of the COSψ method on shot-peened steel and silicon nitride specimens. This prototype stress analyzer was found effective to perform a biaxial or triaxial stress analysis. (author)

X-ray diffraction and imaging with a coherent beam: application to X-ray optical elements and to crystals exhibiting phase inhomogeneities

International Nuclear Information System (INIS)

Masiello, F.

2011-05-01

The exceptional properties of synchrotron light sources have been exploited in very different disciplines, from archaeology to chemistry, from material science to biology, from medicine to physics. Among these properties it is important to mention the high brilliance, continuum spectrum, high degree of polarization, time structure, small source size and divergence of the beam, the last resulting in a high transversal coherence of the produced radiation. This high transversal coherence of the synchrotron sources has permitted the development of new techniques, e.g. phase contrast imaging, X-ray photon correlation spectroscopy and coherent X-ray diffraction imaging (CXDI). This thesis work will consist essentially of three parts. In the first part it will be presented the work done as a member of the X-ray Optics Group of ESRF in the characterization of high quality diamond crystals foreseen as X-ray optical elements. The characterization has been done using different complementary X-ray techniques, such as high resolution diffraction, topography, grazing incidence diffraction, reflectivity and measurements of the coherence preservation using the Talbot effect. In the second part, I will show the result obtained in the study of the temperature behaviours of the domain in periodically poled ferroelectrics crystals. This type of measurements, based on Bragg-Fresnel diffraction, are possible only thanks to the high degree of coherence of the beam. In the third part, I will present the results obtained in the characterization of diamonds foreseen for applications other than X-ray optical elements. (author)

The Wide Field Imager of the International X-ray Observatory

Energy Technology Data Exchange (ETDEWEB)

Stefanescu, A., E-mail: astefan@hll.mpg.d [Max-Planck-Institut Halbleiterlabor, Otto-Hahn-Ring 6, 81739 Muenchen (Germany); Johannes Gutenberg-Universitaet, Inst. f. anorganische und analytische Chemie, 55099 Mainz (Germany); Bautz, M.W. [Kavli Institute for Astrophysics and Space Research, Massachusetts Institute of Technology, Cambridge, MA 02139-4307 (United States); Burrows, D.N. [Department of Astronomy and Astrophysics, Pennsylvania State University, University Park, PA 16802 (United States); Bombelli, L.; Fiorini, C. [Politecnico di Milano, Dipartimento di Elettronica e Informazione, Milano (Italy); INFN Sezione di Milano, Milano (Italy); Fraser, G. [Space Research Centre, Department of Physics and Astronomy, University of Leicester, University Road, Leicester LE1 7RH (United Kingdom); Heinzinger, K. [PNSensor GmbH, Roemerstr. 28, 80803 Muenchen (Germany); Herrmann, S. [Max-Planck-Institut Halbleiterlabor, Otto-Hahn-Ring 6, 81739 Muenchen (Germany); Max-Planck-Institut fuer extraterrestrische Physik, Giessenbachstr., 85748 Garching (Germany); Kuster, M. [Technische Universitaet Darmstadt, Institut fuer Kernphysik, Schlossgartenstr. 9, 64289 Darmstadt (Germany); Lauf, T. [Max-Planck-Institut Halbleiterlabor, Otto-Hahn-Ring 6, 81739 Muenchen (Germany); Max-Planck-Institut fuer extraterrestrische Physik, Giessenbachstr., 85748 Garching (Germany); Lechner, P. [PNSensor GmbH, Roemerstr. 28, 80803 Muenchen (Germany); Lutz, G. [Max-Planck-Institut Halbleiterlabor, Otto-Hahn-Ring 6, 81739 Muenchen (Germany); Max-Planck-Institut fuer Physik, Foehringer Ring 6, 80805 Muenchen (Germany); Majewski, P. [PNSensor GmbH, Roemerstr. 28, 80803 Muenchen (Germany); Meuris, A. [Max-Planck-Institut Halbleiterlabor, Otto-Hahn-Ring 6, 81739 Muenchen (Germany); Max-Planck-Institut fuer extraterrestrische Physik, Giessenbachstr., 85748 Garching (Germany); Murray, S.S. [Harvard/Smithsonian Center for Astrophysics, 60 Garden St., Cambridge, MA 02138 (United States)

2010-12-11

The International X-ray Observatory (IXO) will be a joint X-ray observatory mission by ESA, NASA and JAXA. It will have a large effective area (3 m{sup 2} at 1.25 keV) grazing incidence mirror system with good angular resolution (5 arcsec at 0.1-10 keV) and will feature a comprehensive suite of scientific instruments: an X-ray Microcalorimeter Spectrometer, a High Time Resolution Spectrometer, an X-ray Polarimeter, an X-ray Grating Spectrometer, a Hard X-ray Imager and a Wide-Field Imager. The Wide Field Imager (WFI) has a field-of-view of 18 ftx18 ft. It will be sensitive between 0.1 and 15 keV, offer the full angular resolution of the mirrors and good energy resolution. The WFI will be implemented as a 6 in. wafer-scale monolithical array of 1024x1024 pixels of 100x100{mu}m{sup 2} size. The DEpleted P-channel Field-Effect Transistors (DEPFET) forming the individual pixels are devices combining the functionalities of both detector and amplifier. Signal electrons are collected in a potential well below the transistor's gate, modulating the transistor current. Even when the device is powered off, the signal charge is collected and kept in the potential well below the gate until it is explicitly cleared. This makes flexible and fast readout modes possible.

A Soft X-ray Spectrometer using a Highly Dispersive Multilayer Grating

International Nuclear Information System (INIS)

Warwick, Tony; Padmore, Howard; Voronov, Dmitriy; Yashchuk, Valeriy

2010-01-01

There is a need for higher resolution spectrometers as a tool for inelastic x-ray scattering. Currently, resolving power around R = 10,000 is advertised. Measured RIXS spectra are often limited by this instrumental resolution and higher resolution spectrometers using conventional gratings would be prohibitively large. We are engaged in a development program to build blazed multilayer grating structures for diffracting soft x-rays in high order. This leads to spectrometers with dispersion much higher than is possible using metal coated-gratings. The higher dispersion then provides higher resolution and the multilayer gratings are capable of operating away from grazing incidence as required. A spectrometer design is presented with a total length 3.8 m and capable of 10 5 resolving power.

A Soft X-ray Spectrometer using a Highly Dispersive Multilayer Grating

International Nuclear Information System (INIS)

Warwick, Tony; Padmore, Howard; Voronov, Dmitriy; Yashchuk, Valeriy

2010-01-01

There is a need for higher resolution spectrometers as a tool for inelastic x-ray scattering. Currently, resolving power around R = 10,000 is advertised. Measured RIXS spectra are often limited by this instrumental resolution and higher resolution spectrometers using conventional gratings would be prohibitively large. We are engaged in a development program to build blazed multilayer grating structures for diffracting soft x-rays in high order. This leads to spectrometers with dispersion much higher than is possible using metal coated-gratings. The higher dispersion then provides higher resolution and the multilayer gratings are capable of operating away from grazing incidence as required. A spectrometer design is presented with a total length 3.8m and capable of 10 5 resolving power.

Measurement of the point spread function and effective area of the Solar-A Soft X-ray Telescope mirror

Science.gov (United States)

Lemen, J. R.; Claflin, E. S.; Brown, W. A.; Bruner, M. E.; Catura, R. C.

1989-01-01

A grazing incidence solar X-ray telescope, Soft X-ray Telescope (SXT), will be flown on the Solar-A satellite in 1991. Measurements have been conducted to determine the focal length, Point Spread Function (PSF), and effective area of the SXT mirror. The measurements were made with pinholes, knife edges, a CCD, and a proportional counter. The results show the 1/r character of the PSF, and indicate a half power diameter of 4.9 arcsec and an effective area of 1.33 sq cm at 13.3 A (0.93 keV). The mirror was found to provide a high contrast image with very little X-ray scattering.

Calibration of the High Energy Replicated Optics to Explore the Sun (HEROES) Hard X-ray Telescope

Science.gov (United States)

Wilson-Hodge, Colleen A.; Gaskin, Jessica; Christe, Steven; Shih, Albert; Tennant, Allyn; Swartz, Doug; Kilaru, Kiranmayee; Elsner, Ron; Kolodziejczak, Jeff; Ramsey, Brian

2014-01-01

On September 21-22, 2013, the High Energy Replicated Optics to Explore the Sun (HEROES) hard X-ray telescope, flew as a balloon payload from Ft. Sumner, N.M. HEROES observed the Sun, the black hole binary GRS 1915+105, and the Crab Nebula during its 27 hour flight. In this paper we describe laboratory calibration measurements of the HEROES detectors using line and continuum sources, applications of these measurements to define channel to energy (gain) corrections for observed events and to define detector response matrices. We characterize the HEROES X-ray grazing incidence optics using measurements taken in the Stray-Light (SLF) Facility in Huntsville, AL, and using ray traces.

X-ray scattering from thin organic films and multilayer

International Nuclear Information System (INIS)

Pietsch, U.; Barberka, T. A.; Geue, Th.; Stoemmer, R.

1997-01-01

The real structure of LB-multilayers prepared with fatty-acid salts is dominated by finite-sized scattering aggregates. Their different length scales become visible using AFM. It shows that not the whole substrate is wetted by the film. The molecular order is restricted into domains. These micrometer domains are not homogeneous. They contain mesoscopic subdomains of different heights which vary in steps of double layers. Finally high-resolution AFM-maps display a nearly hexagonal arrangement of molecules within subgrains with a diameter of several 10 nm. This domain structure has to be taken into account when interpreting X-ray diffraction data. The size of the crystalline aggregates is obtained by means of X-ray grazing incidence diffraction. On the mesoscopic scale the domain size is determined by X-ray diffuse scattering experiments. Because Sinha's model fails for the present kind of multilayers, they used another approach for data analysis. The lateral correlation length caused by height fluctuations is estimated without knowledge of a definite correlation function. Additionally the mosaicity of the domain orientation can be taken into account

Inner Stucture of Thin Films of Lamellar Poly(styrene-em>b>-butadiene) Diblock Copolymers as revealed by Grazing-Incidence Small-Angle Scattering

DEFF Research Database (Denmark)

Busch, Peter; Posselt, Dorthe; Smilgies, Detlef-Matthias

2007-01-01

The lamellar orientation in supported, thin films of poly(styrene-b-butadiene) (P(S-b-B)) depends on block copolymer molar mass. We have studied films from nine block copolymer samples with molar masses between 13.9 and 183 kg/mol using grazing-incidence small-angle X-ray scattering (GISAXS) and ...... quantitatively in the framework of our recently developed distorted-wave Born approximation model (Busch, P.; et al. J. Appl. Crystallogr. 2006, 39, 433). The results cannot be explained from enthalpic considerations alone but point to the importance of entropic factors....

X-ray filter for x-ray powder diffraction

Science.gov (United States)

Sinsheimer, John Jay; Conley, Raymond P.; Bouet, Nathalie C. D.; Dooryhee, Eric; Ghose, Sanjit

2018-01-23

Technologies are described for apparatus, methods and systems effective for filtering. The filters may comprise a first plate. The first plate may include an x-ray absorbing material and walls defining first slits. The first slits may include arc shaped openings through the first plate. The walls of the first plate may be configured to absorb at least some of first x-rays when the first x-rays are incident on the x-ray absorbing material, and to output second x-rays. The filters may comprise a second plate spaced from the first plate. The second plate may include the x-ray absorbing material and walls defining second slits. The second slits may include arc shaped openings through the second plate. The walls of the second plate may be configured to absorb at least some of second x-rays and to output third x-rays.

Design and development of the SIMBOL-X hard x-ray optics

Science.gov (United States)

Pareschi, G.; Attinà, P.; Basso, S.; Borghi, G.; Burkert, W.; Buzzi, R.; Citterio, O.; Civitani, M.; Conconi, P.; Cotroneo, V.; Cusumano, G.; Dell'Orto, E.; Freyberg, M.; Hartner, G. D.; Gorenstein, P.; Mattaini, E.; Mazzoleni, F.; Parodi, G.; Romaine, S.; Spiga, D.; Tagliaferri, G.; Valtolina, R.; Valsecchi, G.; Vernani, D.

2008-07-01

The SIMBOL-X formation-flight X-ray mission will be operated by ASI and CNES in 2014, with a large participation of the French and Italian high energy astrophysics scientific community. Also German and US Institutions are contributing in the implementation of the scientific payload. Thanks to the formation-flight architecture, it will be possible to operate a long (20 m) focal length grazing incidence mirror module, formed by 100 confocal multilayer-coated Wolter I shells. This system will allow us to focus X-rays over a very broad energy band, from 0.5 keV up to 80 keV and beyond, with more than two orders of magnitude improvement in angular resolution (20 arcsec HEW) and sensitivity (0.5 µCrab on axis @30 keV) compared to non focusing detectors used so far. The X-ray mirrors will be realized by Ni electroforming replication, already successfully used for BeppoSAX, XMM-Newton, and JET-X/SWIFT; the thickness trend will be about two times less than for XMM, in order to save mass. Multilayer reflecting coatings will be implemented, in order to improve the reflectivity beyond 10 keV and to increase the field of view 812 arcmin at 30 keV). In this paper, the SIMBOL-X optics design, technology and implementation challenges will be discussed; it will be also reported on recent results obtained in the context of the SIMBOL-X optics development activities.

Advances in thin film diffraction instrumentation by X-ray optics

International Nuclear Information System (INIS)

Haase, A.

1996-01-01

The structural characterisation of thin films requires a parallel X-ray beam of high intensity. Parallel beam geometry is commonly used in high resolution and single crystal experiments, but also in the field of X-ray diffraction for polycrystalline material (e.g. in phase, texture and stress analysis). For grazing incidence diffraction (GID), the use of small slits on the primary side and of long soller slits with a flat monochromator on the secondary side is standard. New optical elements have been introduced with polychromatic or monochromatic radiation. By means of different applications the results are compared with those of classical beam optics. X-ray fiber optics utilize total external reflection of X-rays on smooth surfaces. Effects of monochromatization are presented. In many fields of application, fiber optics may replace conventional collimators. The use of primary and secondary channel cut crystals can also produce a high parallel monochromatic X-ray beam. A parabolically bent graded multilayer produces a monochromatic parallel beam of high intensity. Compared with classical Bragg-Brentano (focussing) geometry, excellent results have been obtained, especially for samples with an irregular shape. In combination with a channel cut monochromator there is a substantial gain in intensity leading to an increase of the dynamic intensity range of rocking curves

Advances in thin film diffraction instrumentation by X-ray optics

Energy Technology Data Exchange (ETDEWEB)

Haase, A [Rich. Seifert and Co., Analytical X-ray Systems, Ahrensburg (Germany)

1996-09-01

The structural characterisation of thin films requires a parallel X-ray beam of high intensity. Parallel beam geometry is commonly used in high resolution and single crystal experiments, but also in the field of X-ray diffraction for polycrystalline material (e.g. in phase, texture and stress analysis). For grazing incidence diffraction (GID), the use of small slits on the primary side and of long soller slits with a flat monochromator on the secondary side is standard. New optical elements have been introduced with polychromatic or monochromatic radiation. By means of different applications the results are compared with those of classical beam optics. X-ray fiber optics utilize total external reflection of X-rays on smooth surfaces. Effects of monochromatization are presented. In many fields of application, fiber optics may replace conventional collimators. The use of primary and secondary channel cut crystals can also produce a high parallel monochromatic X-ray beam. A parabolically bent graded multilayer produces a monochromatic parallel beam of high intensity. Compared with classical Bragg-Brentano (focussing) geometry, excellent results have been obtained, especially for samples with an irregular shape. In combination with a channel cut monochromator there is a substantial gain in intensity leading to an increase of the dynamic intensity range of rocking curves.

Mounting and Alignment of Full-Shell Replicated X-Ray Optics

Science.gov (United States)

Gubarev, Mikhail; Arnold, William; Kester, Thomas; Ramsey, Brian; Smithers, Martin

2007-01-01

We are developing grazing-incidence x-ray optics for astronomy. The optics are full-cylinder mirror shells fabricated using electroformed-nickel replication off super-polished mandrels. For space-based applications where weight is at a premium, very-thin-walled, light-weight mirrors are required. Such shells have been fabricated at MSFC with greater than 15 arcsec resolution. The challenge, however, is to preserve this resolution during mounting and assembly. We present here a status report on a mounting and alignment system currently under development at Marshall Space Flight Center to meet this challenge.

X-ray tube

International Nuclear Information System (INIS)

Webley, R.S.

1975-01-01

The object of the invention described is to provide an X-ray tube providing a scanned X-ray output which does not require a scanned electron beam. This is obtained by an X-ray tube including an anode which is rotatable about an axis, and a source of a beam of energy, for example an electron beam, arranged to impinge on a surface of the anode to generate X-radiation substantially at the region of incidence on the anode surface. The anode is rotatable about the axis to move the region of incidence over the surface. The anode is so shaped that the rotation causes the region of incidence to move in a predetermined manner relative to fixed parts of the tube so that the generated X-radiation is scanned in a predetermined manner relative to the tube. (UK)

The Polarimeter for Relativistic Astrophysical X-ray Sources

Science.gov (United States)

Jahoda, Keith; Kallman, Timothy R.; Kouveliotou, Chryssa; Angelini, Lorella; Black, J. Kevin; Hill, Joanne E.; Jaeger, Theodore; Kaaret, Philip E.; Markwardt, Craig B.; Okajima, Takashi; Petre, Robert; Schnittman, Jeremy; Soong, Yang; Strohmayer, Tod E.; Tamagawa, Toru; Tawara, Yuzuru

2016-07-01

The Polarimeter for Relativistic Astrophysical X-ray Sources (PRAXyS) is one of three Small Explorer (SMEX) missions selected by NASA for Phase A study, with a launch date in 2020. The PRAXyS Observatory exploits grazing incidence X-ray mirrors and Time Projection Chamber Polarimeters capable of measuring the linear polarization of cosmic X-ray sources in the 2-10 keV band. PRAXyS combines well-characterized instruments with spacecraft rotation to ensure low systematic errors. The PRAXyS payload is developed at the Goddard Space Flight Center with the Johns Hopkins University Applied Physics Laboratory, University of Iowa, and RIKEN (JAXA) collaborating on the Polarimeter Assembly. The LEOStar-2 spacecraft bus is developed by Orbital ATK, which also supplies the extendable optical bench that enables the Observatory to be compatible with a Pegasus class launch vehicle. A nine month primary mission will provide sensitive observations of multiple black hole and neutron star sources, where theory predicts polarization is a strong diagnostic, as well as exploratory observations of other high energy sources. The primary mission data will be released to the community rapidly and a Guest Observer extended mission will be vigorously proposed.

Asymptotic form of the reciprocity theorem with applications in x-ray scattering

International Nuclear Information System (INIS)

Caticha, Ariel

2000-01-01

The emission of electromagnetic waves from a source within or near a nontrivial medium (with or without boundaries, crystalline or amorphous, with inhomogeneities, absorption, and so on) is sometimes studied using the reciprocity principle which is a variation of the method of Green's functions. If one is only interested in the asymptotic radiation fields the generality of these methods may actually be a shortcoming: obtaining expressions valid for the uninteresting near fields is not just a wasted effort but may be prohibitively difficult. In this work we obtain a modified form of the reciprocity principle which gives the asymptotic radiation field directly. The method may also be used to study scattering problems. We give a few pedagogical examples and then, as more challenging applications, we calculate the specular reflection of x rays by a rough surface and by a smoothly graded surface taking polarization effects into account. In conventional treatments of reflection, x rays are treated as scalar waves; polarization effects are neglected. This is a good approximation at grazing incidence but becomes increasingly questionable for soft x rays and UV at higher incidence angles

Regional livestock grazing, human demography and fire incidence in the Portuguese landscape

Directory of Open Access Journals (Sweden)

Filipa Torres-Manso

2014-04-01

Full Text Available Aim of study:Wildfire incidence in Portugal is high in comparison with other Mediterranean Europe countries. Wildfire problems have been worsened by complex interactions between land use, livestock grazing and human population during the 20th century. In this study we try to understand these interactions and relationships.Area of study: Portugal country. Material and Methods: For the mainland Portuguese territory we present a statistical temporal analysis (1930-2001 based on the densities of livestock grazing and human inhabitants at the smallest administrative unit level, the parish. We compare these data with fire incidence descriptors (average area burned and average fire density between 1990 and 2007. Research highlights: We have identified clusters of parishes sharing common trends in the evolution of livestock and human inhabitant densities. A cause-effect relationship was not detected between livestock grazing density and fire incidence. However, the results point out clusters of parishes where conflicts between forest, fire and livestock grazing are important in the North, Centre and South regions of Portugal.Key Words: Livestock grazing; inhabitants; forest; fire; vegetation.

Simulating X-ray diffraction of textured films

DEFF Research Database (Denmark)

Breiby, Dag W.; Bunk, Oliver; Andreasen, Jens Wenzel

2008-01-01

Computationally efficient simulations of grazing-incidence X-ray diffraction (GIXD) are discussed, with particular attention given to textured thin polycrystalline films on supporting substrates. A computer program has been developed for simulating scattering from thin films exhibiting varying...... degrees of preferred orientation. One emphasized common case is that of a 'fibre' symmetry axis perpendicular to the sample plane, resulting from crystallites having one well defined crystal facet towards the substrate, but no preferred inplane orientation. Peak splitting caused by additional scattering......, the mathematically simplest possible descriptions are sought whenever feasible. The practical use of the program is demonstrated for a selected thin-film example, perylene, which is of relevance for organic electronics....

Arrangement for X-ray shield

International Nuclear Information System (INIS)

1980-01-01

X-ray screen unit consisting of a light transmissive carrier onto which scintillation material is deposited, which is able to generate light under the influence of incident X-ray irradiation, characterised in that the X-ray screen comprises a number of sectors, wherein the surface with respect to the incident X-radiation is maintained at an acute angle. (G.C.)

The X-ray transition radiation; Le rayonnement de transition X

Energy Technology Data Exchange (ETDEWEB)

Couillaud, Ch

2000-07-01

The interest of producing high-energy radiation using a small-size electron accelerator is growing since many years. It appeared that such accelerators should drive x-ray sources to produce a high flux of radiation. The range of photon-energy available when using electron linacs, for example, is between a few tens of eV and the maximum electron kinetic energy. The transition radiation, which is produced when a charged particle crosses the interface between two media of different permittivities, is a very promising way due to its high production rate. We present here a study of this physical process involving moderate-energy relativistic electrons (20 MeV). We recall the main characteristics of the radiation when the interface is crossed at normal incidence and derive the analytical production yields when the interaction takes place at grazing incidence. The results for both geometries are compared. Finally, the scale laws allowing the optimization of the spectral source brilliance are presented. (author)

FIRST IMAGES FROM THE FOCUSING OPTICS X-RAY SOLAR IMAGER

Energy Technology Data Exchange (ETDEWEB)

Krucker, Säm; Glesener, Lindsay; Turin, Paul; McBride, Stephen; Glaser, David; Fermin, Jose; Lin, Robert [Space Sciences Laboratory, University of California at Berkeley, Berkeley, CA (United States); Christe, Steven [NASA Goddard Space Flight Center, Greenbelt, MD (United States); Ishikawa, Shin-nosuke [National Astronomical Observatory, Mitaka (Japan); Ramsey, Brian; Gubarev, Mikhail; Kilaru, Kiranmayee [NASA Marshall Space Flight Center, Huntsville, AL (United States); Takahashi, Tadayuki; Watanabe, Shin; Saito, Shinya [Institute of Space and Astronautical Science (ISAS)/JAXA, Sagamihara (Japan); Tajima, Hiroyasu [Solar-Terrestial Environment Laboratory, Nagoya University, Nagoya (Japan); Tanaka, Takaaki [Department of Physics, Kyoto University, Kyoto (Japan); White, Stephen [Air Force Research Laboratory, Albuquerque, NM (United States)

2014-10-01

The Focusing Optics X-ray Solar Imager (FOXSI) sounding rocket payload flew for the first time on 2012 November 2, producing the first focused images of the Sun above 5 keV. To enable hard X-ray (HXR) imaging spectroscopy via direct focusing, FOXSI makes use of grazing-incidence replicated optics combined with fine-pitch solid-state detectors. On its first flight, FOXSI observed several targets that included active regions, the quiet Sun, and a GOES-class B2.7 microflare. This Letter provides an introduction to the FOXSI instrument and presents its first solar image. These data demonstrate the superiority in sensitivity and dynamic range that is achievable with a direct HXR imager with respect to previous, indirect imaging methods, and illustrate the technological readiness for a spaceborne mission to observe HXRs from solar flares via direct focusing optics.

Graphite irradiated by swift heavy ions under grazing incidence

CERN Document Server

Liu, J; Müller, C; Neumann, R

2002-01-01

Highly oriented pyrolytic graphite is irradiated with various heavy projectiles (Ne, Ni, Zn, Xe and U) in the MeV to GeV energy range under different oblique angles of incidence. Using scanning tunneling microscopy, the impact zones are imaged as hillocks protruding from the surface. The diameter of surface-grazing tracks varies between 3 nm (Ne) and 6 nm (U), which is about twice as large as under normal beam incidence. Exclusively for U and Xe projectiles, grazing tracks exhibit long comet-like tails consisting of successive little bumps indicating that the damage along the ion path is discontinuous even for highest electronic stopping powers.

X-Ray Diffraction and Reflectivity Validation of the Depletion Attraction in the Competitive Adsorption of Lung Surfactant and Albumin

DEFF Research Database (Denmark)

Stenger, Patric C.; Wu, Guohui; Miller, Chad E.

2009-01-01

as on a pristine interface, but with a more compact lattice corresponding to a small increase in the surface pressure. These results confirm that albumin adsorption creates a physical barrier that inhibits LS adsorption, and that PEG in the subphase generates a depletion attraction between the LS aggregates...... to subsequent LS adsorption that can be overcome by the depletion attraction induced by polyethylene glycol (PEG) in solution. A combination of grazing incidence x-ray diffraction (GIXD), x-ray reflectivity (XR), and pressure-area isotherms provides molecular-resolution information on the location...

Structural analysis of polymer thin films using GISAXS in the tender X-ray region: Concept and design of GISAXS experiments using the tender X-ray energy at BL-15A2 at the Photon Factory

Energy Technology Data Exchange (ETDEWEB)

Takagi, H., E-mail: takagih@post.kek.jp; Igarashi, N.; Mori, T.; Saijo, S.; Nagatani, Y.; Shimizu, N. [Photon Factory, Institute of Materials Structure Science, High Energy Accelerator Research Organization, 1-1 Oho, Tsukuba, Ibaraki 305-0801 (Japan); Ohta, H. [Mitsubishi Electric System & Service Co., Ltd, Accelerator Engineering Center, 2-8- 8 Umezono, Tsukuba, Ibaraki 305-0045 (Japan); Yamamoto, K. [Graduate School of Engineering, Department of Materials Science & Technology, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466-8555 (Japan)

2016-10-14

If small angle X-ray scattering (SAXS) utilizing the soft X-ray region is available, advanced and unique experiments, which differ from traditional SAXS methods, can be realized. For example, grazing-incidence small angle X-ray scattering (GISAXS) using hard X-ray is a powerful tool for understanding the nanostructure in both vertical and lateral directions of thin films, while GISAXS utilizing the tender X-ray region (SX-GISAXS) enables depth-resolved analysis as well as a standard GISAXS analysis in thin films. Thus, at BL-15A2 at the Photon Factory, a dedicated diffractometer for SX-GISAXS (above 2.1 keV) was constructed. This diffractometer is composed of four vacuum chambers and can be converted into the vacuum state from the sample chamber in front of the detector surface. Diffractions are clearly observed until 12th peak when measuring collagen by SAXS with an X-ray energy of 2.40 keV and a camera length of 825 mm. Additionally, we conducted the model experiment using SX-GISAXS with an X-ray energy of 2.40 keV to confirm that a poly(methyl methacrylate)-poly(n-butyl acrylate) block copolymer thin film has a microphase-separated structure in the thin film, which is composed of lamellae aligned both parallel and perpendicular to the substrate surface. Similarly, in a polystyrene-poly(methyl methacrylate) block copolymer thin film, SX-GISAXS with 3.60 keV and 5.73 keV revealed that hexagonally packed cylinders are aligned parallel to the substrate surface. The incident angle dependence of the first order peak position of the q{sub z} direction obtained from experiments at various incident X-ray energies agrees very well with the theoretical one calculated from the distorted wave Born approximation.

Structural analysis of polymer thin films using GISAXS in the tender X-ray region: Concept and design of GISAXS experiments using the tender X-ray energy at BL-15A2 at the Photon Factory

International Nuclear Information System (INIS)

Takagi, H.; Igarashi, N.; Mori, T.; Saijo, S.; Nagatani, Y.; Shimizu, N.; Ohta, H.; Yamamoto, K.

2016-01-01

If small angle X-ray scattering (SAXS) utilizing the soft X-ray region is available, advanced and unique experiments, which differ from traditional SAXS methods, can be realized. For example, grazing-incidence small angle X-ray scattering (GISAXS) using hard X-ray is a powerful tool for understanding the nanostructure in both vertical and lateral directions of thin films, while GISAXS utilizing the tender X-ray region (SX-GISAXS) enables depth-resolved analysis as well as a standard GISAXS analysis in thin films. Thus, at BL-15A2 at the Photon Factory, a dedicated diffractometer for SX-GISAXS (above 2.1 keV) was constructed. This diffractometer is composed of four vacuum chambers and can be converted into the vacuum state from the sample chamber in front of the detector surface. Diffractions are clearly observed until 12th peak when measuring collagen by SAXS with an X-ray energy of 2.40 keV and a camera length of 825 mm. Additionally, we conducted the model experiment using SX-GISAXS with an X-ray energy of 2.40 keV to confirm that a poly(methyl methacrylate)-poly(n-butyl acrylate) block copolymer thin film has a microphase-separated structure in the thin film, which is composed of lamellae aligned both parallel and perpendicular to the substrate surface. Similarly, in a polystyrene-poly(methyl methacrylate) block copolymer thin film, SX-GISAXS with 3.60 keV and 5.73 keV revealed that hexagonally packed cylinders are aligned parallel to the substrate surface. The incident angle dependence of the first order peak position of the q_z direction obtained from experiments at various incident X-ray energies agrees very well with the theoretical one calculated from the distorted wave Born approximation.

Direct quantification of TiO{sub 2} nanoparticles in suspension by grazing-incidence X-ray fluorescence spectrometry: Influence of substrate pre-treatment in the deposition process

Energy Technology Data Exchange (ETDEWEB)

Motellier, S., E-mail: Sylvie.motellier@cea.fr [Commissariat à l' Energie Atomique et aux Energies alternatives, DRT/LITEN/DTNM/LCSN, 17 rue des martyrs, F-38054 GRENOBLE CEDEX (France); Derrough, S.; Locatelli, D. [Commissariat à l’Energie Atomique et aux Energies alternatives, DRT/NanoSafety Plateform, 17 rue des martyrs, F-38054 GRENOBLE CEDEX (France); Amdaoud, M.; Lhaute, K. [Commissariat à l' Energie Atomique et aux Energies alternatives, DRT/LITEN/DTNM/LCSN, 17 rue des martyrs, F-38054 GRENOBLE CEDEX (France)

2013-10-01

X-ray fluorescence at grazing incidence (GIXRF) was investigated as a method for the quantification of TiO{sub 2} nanoparticles in aqueous suspensions. One of the major advantages of this technique is the possibility to analyze the particles without pre-treatment, like harsh acid digestion, as required by most other conventional methods. However, reliable quantitative measurements require a number of precautions. Particularly, the deposition process of the sample on the flat reflecting substrate must maintain homogeneity in composition and concentration over the entire surface of the deposition residue once dried. Scanning electron microscopy showed that using an adhesive coating of the substrate significantly improves the morphology and chemical homogeneity of the residue, hence leading to better performance of the method from a quantitative point of view. Linear calibration curves using internal standardization were established with ionic Ti and with two different types of TiO{sub 2} nanoparticles. Low limits of detections of 18 μg L{sup −1} and 52 μg L{sup −1} at incident angles of 0.20° and 0.75°, respectively, were obtained. It was found that correlation factors of the calibration linear fits were particle-size dependent, which was assigned to sampling problems due to possible incomplete dispersion of the particles in suspensions. The measured fluorescence of the dried deposits changed within a 4-month timespan for both types of TiO{sub 2} nanoparticles, demonstrating the very peculiar behavior of these particulate samples. - Highlights: • Suspensions of TiO{sub 2} nanoparticles were quantitatively analyzed by GIXRF. • The substrate was coated with an adhesive film prior to sample deposition. • Improved spatial homogeneity of the dry spot residue was confirmed by SEM/EDX. • Linear calibration curves were obtained with ionic Cr as internal standard. • Ti low limits of detections were in the 20–50 μg L{sup −1}.

Short-wavelength soft-x-ray laser pumped in double-pulse single-beam non-normal incidence

International Nuclear Information System (INIS)

Zimmer, D.; Ros, D.; Guilbaud, O.; Habib, J.; Kazamias, S.; Zielbauer, B.; Bagnoud, V.; Ecker, B.; Aurand, B.; Kuehl, T.; Hochhaus, D. C.; Neumayer, P.

2010-01-01

We demonstrated a 7.36 nm Ni-like samarium soft-x-ray laser, pumped by 36 J of a neodymium:glass chirped-pulse amplification laser. Double-pulse single-beam non-normal-incidence pumping was applied for efficient soft-x-ray laser generation. In this case, the applied technique included a single-optic focusing geometry for large beam diameters, a single-pass grating compressor, traveling-wave tuning capability, and an optimized high-energy laser double pulse. This scheme has the potential for even shorter-wavelength soft-x-ray laser pumping.

Nondestructive characterization of surface chemical wear films via X-rays

Energy Technology Data Exchange (ETDEWEB)

Hershberger, J.; Ajayi, O.O.; Fenske, G.R

2004-01-15

This work describes and demonstrates a suite of techniques for the non-destructive examination of surface films formed from oil additives. X-Ray diffraction, reflectivity and fluorescence have been used in grazing-incidence geometry to provide information on the thickness, roughness, density, structure and composition of the layers that compose reaction films. The lubricating oils were not rinsed off the surfaces of the samples before analysis. Films were formed from neat polyalphaolefin (PAO) oil and PAO with chloroform, dimethyl disulfide, or zinc or molybdenum dialkyl dithiophosphate additive. A thick layer of crystalline FeO formed during wear lubricated by neat PAO.

Near-surface density profiling of Fe ion irradiated Si (100) using extremely asymmetric x-ray diffraction by variation of the wavelength

Energy Technology Data Exchange (ETDEWEB)

Khanbabaee, B., E-mail: khanbabaee@physik.uni-siegen.de; Pietsch, U. [Solid State Physics, University of Siegen, D-57068 Siegen (Germany); Facsko, S. [Helmholtz-Zentrum Dresden-Rossendorf, 01314 Dresden (Germany); Doyle, S. [Synchrotron Light Source ANKA, Hermann-von-Helmholtz-Platz 1, D-76344 Eggenstein-Leopoldshafen (Germany)

2014-10-20

In this work, we report on correlations between surface density variations and ion parameters during ion beam-induced surface patterning process. The near-surface density variations of irradiated Si(100) surfaces were investigated after off-normal irradiation with 5 keV Fe ions at different fluences. In order to reduce the x-ray probing depth to a thickness below 5 nm, the extremely asymmetrical x-ray diffraction by variation of wavelength was applied, exploiting x-ray refraction at the air-sample interface. Depth profiling was achieved by measuring x-ray rocking curves as function of varying wavelengths providing incidence angles down to 0°. The density variation was extracted from the deviations from kinematical Bragg angle at grazing incidence angles due to refraction of the x-ray beam at the air-sample interface. The simulations based on the dynamical theory of x-ray diffraction revealed that while a net near-surface density decreases with increasing ion fluence which is accompanied by surface patterning, there is a certain threshold of ion fluence to surface density modulation. Our finding suggests that the surface density variation can be relevant with the mechanism of pattern formation.

Comparison of the incidence of oncogenic transformation produced by x-rays, misonidazole, and chemotherapy agents

International Nuclear Information System (INIS)

Hall, E.J.; Miller, R.C.; Osmak, R.; Zimmerman, M.

1982-01-01

An established line of mouse fibroblasts (10T1/2 cells) cultured in vitro was used to compare the incidence of oncogenic transformation produced by x rays, the hypoxic cell radiosensitizer misonidazole, and a range of commonly used chemotherapy agents. A 3-day exposure to misonidazole at a concentration obtainable during treatment produced an incidence of transformation similar to that of about 50 rad. When chemotherapy agents were tested at concentrations comparable to those used clinically and matched to produce similar cell killing, the incidence of transformation varied widely: some agents, such as vincristine, did not produce transformation at a level detectable above background, while others, such as cis-plantinum, appear to be potent carcinogens and produce transformation at a rate orders of magnitude higher than that achieved with x rays

Comparison of conventional and total reflection excitation geometry for fluorescence X-ray absorption spectroscopy on droplet samples

International Nuclear Information System (INIS)

Falkenberg, G.; Pepponi, G.; Streli, C.; Wobrauschek, P.

2003-01-01

X-ray absorption fine structure (XAFS) experiments in fluorescence mode have been performed in total reflection excitation geometry and conventional 45 deg. /45 deg. excitation/detection geometry for comparison. The experimental results have shown that XAFS measurements are feasible under normal total reflection X-ray fluorescence (TXRF) conditions, i.e. on droplet samples, with excitation in grazing incidence and using a TXRF experimental chamber. The application of the total reflection excitation geometry for XAFS measurements increases the sensitivity compared to the conventional geometry leading to lower accessible concentration ranges. However, XAFS under total reflection excitation condition fails for highly concentrated samples because of the self-absorption effect

The Focusing Optics X-ray Solar Imager (FOXSI) SMEX Mission

Science.gov (United States)

Christe, S.; Shih, A. Y.; Krucker, S.; Glesener, L.; Saint-Hilaire, P.; Caspi, A.; Allred, J. C.; Battaglia, M.; Chen, B.; Drake, J. F.; Gary, D. E.; Goetz, K.; Gburek, S.; Grefenstette, B.; Hannah, I. G.; Holman, G.; Hudson, H. S.; Inglis, A. R.; Ireland, J.; Ishikawa, S. N.; Klimchuk, J. A.; Kontar, E.; Kowalski, A. F.; Massone, A. M.; Piana, M.; Ramsey, B.; Schwartz, R.; Steslicki, M.; Turin, P.; Ryan, D.; Warmuth, A.; Veronig, A.; Vilmer, N.; White, S. M.; Woods, T. N.

2017-12-01

We present FOXSI (Focusing Optics X-ray Solar Imager), a Small Explorer (SMEX) Heliophysics mission that is currently undergoing a Phase A concept study. FOXSI will provide a revolutionary new perspective on energy release and particle acceleration on the Sun. FOXSI is a direct imaging X-ray spectrometer with higher dynamic range and better than 10x the sensitivity of previous instruments. Flown on a 3-axis-stabilized spacecraft in low-Earth orbit, FOXSI uses high-angular-resolution grazing-incidence focusing optics combined with state-of-the-art pixelated solid-state detectors to provide direct imaging of solar hard X-rays for the first time. FOXSI is composed of a pair of x-ray telescopes with a 14-meter focal length enabled by a deployable boom. Making use of a filter-wheel and high-rate-capable solid-state detectors, FOXSI will be able to observe the largest flares without saturation while still maintaining the sensitivity to detect x-ray emission from weak flares, escaping electrons, and hot active regions. This mission concept is made possible by past experience with similar instruments on two FOXSI sounding rocket flights, in 2012 and 2014, and on the HEROES balloon flight in 2013. FOXSI's hard X-ray imager has a field of view of 9 arcminutes and an angular resolution of better than 8 arcsec; it will cover the energy range from 3 up to 50-70 keV with a spectral resolution of better than 1 keV; and it will have sub-second temporal resolution.

X-ray spectrometer spectrograph telescope system. [for solar corona study

Science.gov (United States)

Bruner, E. C., Jr.; Acton, L. W.; Brown, W. A.; Salat, S. W.; Franks, A.; Schmidtke, G.; Schweizer, W.; Speer, R. J.

1979-01-01

A new sounding rocket payload that has been developed for X-ray spectroscopic studies of the solar corona is described. The instrument incorporates a grazing incidence Rowland mounted grating spectrograph and an extreme off-axis paraboloic sector feed system to isolate regions of the sun of order 1 x 10 arc seconds in size. The focal surface of the spectrograph is shared by photographic and photoelectric detection systems, with the latter serving as a part of the rocket pointing system control loop. Fabrication and alignment of the optical system is based on high precision machining and mechanical metrology techniques. The spectrograph has a resolution of 16 milliangstroms and modifications planned for future flights will improve the resolution to 5 milliangstroms, permitting line widths to be measured.

Properties of grazing-incidence pulsed Ti:sapphire laser oscillator

International Nuclear Information System (INIS)

Tamura, Koji

2008-03-01

A pulsed operation of a grazing-incidence double-grating Ti:sapphire laser oscillator that consists of a gain medium, back mirror, and a pair of gratings, was studied. A stable single-longitudinal-mode operation was achievable. From the calculation of the optical path trajectories, it can be explained by the increased beam walk-off from the gain medium by the introduction of the second grating compared with the conventional single-grating grazing-incidence cavity geometry. The improved spectral property was also explained by the calculations of increased dispersion. The results indicate that the oscillator configuration was useful for the applications which require stable mode operation and narrow linewidth such as the high resolution spectroscopy or the laser isotope separation. (author)

Perfect-crystal x-ray optics to treat x-ray coherence

International Nuclear Information System (INIS)

Yamazaki, Hiroshi; Ishikawa, Tetsuya

2007-01-01

X-ray diffraction of perfect crystals, which serve as x-ray monochromator and collimator, modifies coherence properties of x-ray beams. From the time-dependent Takagi-Taupin equations that x-ray wavefields obey in crystals, the reflected wavefield is formulated as an integral transform of a general incident wavefield with temporal and spatial inhomogeneity. A reformulation of rocking-curve profiles from the field solution of the Takagi-Taupin equations allows experimental evaluation of the mutual coherence function of x-ray beam. The rigorous relationship of the coherence functions between before and after reflection clarifies how the coherence is transferred by a crystal. These results will be beneficial to developers of beamline optics for the next generation synchrotron sources. (author)

Grazing incidence diffraction : A review

Energy Technology Data Exchange (ETDEWEB)

Gilles, B [LTPCM, ENSEEG. St. Martin d` Heres. (France)

1996-09-01

Different Grazing Incidence Diffraction (GID) methods for the analysis of thin films and multilayer structures are reviewed in three sections: the reflectivity is developed in the first one, which includes the non-specular diffuse scattering. The second one is devoted to the extremely asymmetric Bragg diffraction and the third one to the in-plane Bragg diffraction. Analytical formulations of the scattered intensities are developed for each geometry, in the framework of the kinetical analysis as well as the dynamical theory. Experimental examples are given to illustrate the quantitative possibility of the GID techniques.

In situ synchrotron X-ray studies during metal-organic chemical vapor deposition of semiconductors

Energy Technology Data Exchange (ETDEWEB)

Thompson, Carol [Northern Illinois Univ., DeKalb, IL (United States); Argonne National Lab., Argonne, IL (United States); Highland, Matthew J.; Perret, Edith; Fuoss, Paul H.; Streiffer, Stephen K.; Stephenson, G. Brian [Argonne National Lab., Argonne, IL (United States); Richard, Marie-Ingrid [Universite Paul Cezanne Aix-Marseille, Marseille (France)

2012-07-01

In-situ, time-resolved techniques provide valuable insight into the complex interplay of surface structural and chemical evolution occurring during materials synthesis and processing of semiconductors. Our approach is to observe the evolution of surface structure and morphology at the atomic scale in real-time during metal organic vapor phase deposition (MOCVD) by using grazing incidence x-ray scattering and X-ray fluorescence, coupled with visible light scattering. Our vertical-flow MOCVD chamber is mounted on a 'z-axis' surface diffractometer designed specifically for these studies of the film growth, surface evolution and the interactions within a controlled growth environment. These techniques combine the ability of X-rays to penetrate a complex environment for measurements during growth and processing, with the sensitivity of surface scattering techniques to atomic and nanoscale structure. In this talk, we outline our program and discuss examples from our in-situ and real-time X-ray diffraction and fluorescence studies of InN, GaN, and InGaN growth on GaN(0001).

Soft x-ray interferometry

International Nuclear Information System (INIS)

1993-09-01

The purpose of the soft x-ray interferometry workshop held at Lawrence Berkeley Laboratory was to discuss with the scientific community the proposed technical design of the soft x-ray Fourier-transform spectrometer being developed at the ALS. Different design strategies for the instrument's components were discussed, as well as detection methods, signal processing issues, and how to meet the manufacturing tolerances that are necessary for the instrument to achieve the desired levels of performance. Workshop participants were encouraged to report on their experiences in the field of Fourier transform spectroscopy. The ALS is developing a Fourier transform spectrometer that is intended to operate up to 100 eV. The motivation is solely improved resolution and not the throughput (Jaquinot) or multiplex (Fellgett) advantage, neither of which apply for the sources and detectors used in this spectral range. The proposed implementation of this is via a Mach-Zehnder geometry that has been (1) distorted from a square to a rhombus to get grazing incidence of a suitable angle for 100 eV and (2) provided with a mirror-motion system to make the path difference between the interfering beams tunable. The experiment consists of measuring the emergent light intensity (I(x)) as a function of the path difference (x). The resolving power of the system is limited by the amount of path difference obtainable that is 1 cm (one million half-waves at 200 angstrom wavelength) in the design thus allowing a resolving power of one million. The free spectral range of the system is limited by the closeness with which the function I(x) is sampled. It is proposed to illuminate a helium absorption cell with roughly 1%-band-width light from a monochromator thus allowing one hundred aliases without spectral overlap even for sampling of I(x) at one hundredth of the Nyquist frequency

Grazing incidence polarized neutron scattering in reflection ...

Indian Academy of Sciences (India)

journal of. January 2012 physics pp. 1–58. Grazing incidence polarized ..... atomic distances, the neutron has an energy which is low compared to molecular binding ...... cores and that of the Co ions in the AF oxide coatings. ...... [32] C Leighton, M R Fitzsimmons, P Yashar, A Hoffmann, J Nogus, J Dura, C F Majkrzak and.

Low-angle polarized neutron and X-ray scattering from magnetic nanolayers and nanostructures

CERN Document Server

Paul, Amitesh

2017-01-01

This research monograph presents the latest results related to the characterization of low dimensional systems. Low-angle polarized neutron scattering and X-ray scattering at grazing incidence are used as the two main techniques to explore various physical phenomena of these systems. Special focus is put on systems like thin film transition metal and rare-earth layers, oxide heterostructures, hybrid systems, self-assembled nanostructures and self-diffusion.  Readers will gain in-depth knowledge about the usage of specular scattering and off-specular scattering techniques. Investigation of in-plane and out-of-plane structures and magnetism with vector magnetometric information is illustrated comprehensively. The book caters to a wide audience working in the field of nano-dimensional magnetic systems and the neutron and X-ray reflectometry community in particular.

Precision white-beam slit design for high power density x-ray undulator beamlines at the Advanced Photon Source

International Nuclear Information System (INIS)

Shu, D.; Brite, C.; Nian, T.

1994-01-01

A set of precision horizontal and vertical white-beam slits has been designed for the Advanced Photon Source (APS) X-ray undulator beamlines at Argonne National Laboratory. There are several new design concepts applied in this slit set, including: grazing-incidence knife-edge configuration to minimize the scattering of X-rays downstream, enhanced heat transfer tubing to provide water cooling, and a second slit to eliminate the thermal distortion on the slit knife edge. The novel aspect of this design is the use of two L-shaped knife-edge assemblies, which are manipulated by two precision X-Z stepping linear actuators. The principal and structural details of the design for this slit set are presented in this paper

Analysis of thin films prepared by vacuum-evaporation and dropping solution by Takeoff Angle-Dependent X-Ray Fluorescence spectroscopy at glancing incidence

International Nuclear Information System (INIS)

Tsuji, Kouichi; Hirokawa, Kichinosuke; Mitose, Kengo.

1995-01-01

We have introduced Takeoff Angle-Dependent X-Ray Fluorescence (TAD-XRF) method for thin film and surface analysis. In this method, the sample on the optically flat substrate is irradiated with the glancing incidence of the primary X-ray, and the fluorescent X-rays emitted from the sample are detected at the glancing takeoff angle. We had previously calculated the relationship between the fluorescent X-ray intensity and the takeoff angle at the glancing incidence. The characterization of the thin film is achieved by investigating the dependence of the fluorescent X-ray intensity on the takeoff angle with the calculated curve. Using this analytical method, we have reported the results of the TAD-XRF measured for the evaporated thin films and the dried films from dropping solution in this paper. The effect of the thickness of the thin film, the density of the substrate and the incident angle on the TAD-XRF curve has been reported. In the case of the dried film from the dropping solution, a broad peak was observed at the takeoff angle which was close to the critical angle for the total reflection of the fluorescent X-ray in the TAD-XRF curve. This broad peak was explained by the double-excitation of the incident beam and the refracted beam of the fluorescent X-ray with the assumption that the X-ray which has a same wavelength to the observed fluorescent X-ray impinges upon the sample surface, because the reciprocity theorem is expected in the X-ray region. (author)

Energy-dispersive X-ray reflectivity and GID for real-time growth studies of pentacene thin films

International Nuclear Information System (INIS)

Kowarik, S.; Gerlach, A.; Leitenberger, W.; Hu, J.; Witte, G.; Woell, C.; Pietsch, U.; Schreiber, F.

2007-01-01

We use energy-dispersive X-ray reflectivity and grazing incidence diffraction (GID) to follow the growth of the crystalline organic semiconductor pentacene on silicon oxide in-situ and in real-time. The technique allows for monitoring Bragg reflections and measuring X-ray growth oscillations with a time resolution of 1 min in a wide q-range in reciprocal space extending over 0.25-0.80 A -1 , i.e. sampling a large number of Fourier components simultaneously. A quantitative analysis of growth oscillations at several q-points yields the evolution of the surface roughness, showing a marked transition from layer-by-layer growth to strong roughening after four monolayers of pentacene have been deposited

Investigation of aperiodic W/C multi-layer mirror for X-ray optics

International Nuclear Information System (INIS)

Wang Zhanshan; Cheng Xinbin; Zhu Jingtao; Huang Qiushi; Zhang Zhong; Chen Lingyan

2011-01-01

Design, fabrication and characterization of aperiodic tungsten/carbon (W/C) multi-layer mirror were studied. W/C multi-layer was designed as a broad-angle reflective supermirror for Cu-Kα line (λ = 0.154 nm) in the grazing incident angular range (0.9-1.1 deg.) using simulated annealing algorithm. To deposit the W/C depth-graded multi-layer mirror accurately, we introduce an effective layer growth rate as a function of layer thickness. This method greatly improves the reflectivity curve compared to the conventional multi-layer mirror prepared with constant growth rate. The deposited multi-layer mirror exhibits an average reflectivity of 19% over the grazing incident angle range of 0.88-1.08 deg. which mainly coincides with the designed value. Furthermore, the physical mechanisms were discussed and the re-sputtering process of light-atom layers is accounted for the modification of layer thicknesses which leads to the effective growth rates. Using this calibration method, the aperiodic multi-layer mirrors can be better fabricated for X-ray optics.

Development of iridium coated x-ray mirrors for astronomical applications

Science.gov (United States)

Döhring, Thorsten; Probst, Anne-Catherine; Emmerich, Florian; Stollenwerk, Manfred; Stehlíková, Veronika; Friedrich, Peter; Damm, Christine

2017-08-01

Future space-based X-ray observatories need to be very lightweight for launcher mass constraints. Therefore they will use a reduced mirror thickness, which results in the additional requirement of low coating stress to avoid deformation of the initial precisely shaped mirror substrates. Due to their excellent reflection properties iridium coatings are sometimes applied for grazing incidence mirrors in astronomical X-ray telescopes. At Aschaffenburg University of Applied Sciences the coating of thin iridium films by an RF-magnetron sputtering technique is under development. The work is embedded in collaborations with the Max-Planck-Institute for Extraterrestrial Physics in Germany, the Czech Technical University in Prague, the Osservatorio Astronomico di Brera in Italy, the German Leibniz Institute for Solid State and Materials Research in Dresden, and the French Institute Fresnel. Sputtering with different parameters leads to iridium films with different properties. The current work is focused on the microstructure of the iridium coatings to study the influence of the substrate and of the argon gas pressure on the thin film growing process. Correlations between coating density, surface micro-roughness, the crystalline structure of the iridium layers, and the expected reflectivity of the X-ray mirror as well as coating stress effects are presented and discussed. The final goal of the project is to integrate the produced prototype mirrors into an X-ray telescope module. On a longer timescale measurements of the mirror modules optical performance are planned at the X-ray test facility PANTER.

X-ray diffractometer configurations for thin film analysis

International Nuclear Information System (INIS)

Haase, A.

1996-01-01

A presentation of various configurations of focusing Seemann-Bohlin diffractometer, parafocusing Bragg-Brentano diffractometer and parallel beam are demonstrated. Equipped with different thin film attachments a comparison to conventional measurements are given. The application of different detector types like scintillation, gas proportional, electroluminescence (LUX) and solid state are described. Typical instrument set-ups for reflectometry, grazing incidence diffraction, total reflection, high resolution X-ray diffraction are explained. Different elements like slits, soller slits, pinhole collimators, crystal monochromators, monofiber (FOX) and polycapillaries (multifiber lens, Kumakhov lens'), flat or curved multilayer with constant or variable d-spacing, and their combinations are presented. The comparison of different beam conditioners in peak-to-background ratios are given. Wavelength dispersive scans show the energy discrimination possibilities of different beam optics

X-ray diffractometer configurations for thin film analysis

Energy Technology Data Exchange (ETDEWEB)

Haase, A [Rich. Seifert and Co., Analytical X-ray Systems, Ahrensburg (Germany)

1996-09-01

A presentation of various configurations of focusing Seemann-Bohlin diffractometer, parafocusing Bragg-Brentano diffractometer and parallel beam are demonstrated. Equipped with different thin film attachments a comparison to conventional measurements are given. The application of different detector types like scintillation, gas proportional, electroluminescence (LUX) and solid state are described. Typical instrument set-ups for reflectometry, grazing incidence diffraction, total reflection, high resolution X-ray diffraction are explained. Different elements like slits, soller slits, pinhole collimators, crystal monochromators, monofiber (FOX) and polycapillaries (multifiber lens, Kumakhov lens`), flat or curved multilayer with constant or variable d-spacing, and their combinations are presented. The comparison of different beam conditioners in peak-to-background ratios are given. Wavelength dispersive scans show the energy discrimination possibilities of different beam optics.

Thin film beam splitter multiple short pulse generation for enhanced Ni-like Ag x-ray laser emission.

Science.gov (United States)

Cojocaru, Gabriel V; Ungureanu, Razvan G; Banici, Romeo A; Ursescu, Daniel; Delmas, Olivier; Pittman, Moana; Guilbaud, Olivier; Kazamias, Sophie; Cassou, Kevin; Demailly, Julien; Neveu, Olivier; Baynard, Elsa; Ros, David

2014-04-15

An alternative, novel multiple pulse generation scheme was implemented directly after the optical compressor output of an x-ray pump laser. The new method uses a polarization sensitive thin film beam splitter and a half-wavelength wave plate for tuning the energy ratio in the multiple short pulses. Based on this method, an extensive study was made of the running parameters for a grazing incidence pumped silver x-ray laser (XRL) pumped with a long pulse of 145 mJ in 6 ns at 532 nm and up to 1.45 J in few picoseconds at 810 nm. Fivefold enhancement in the emission of the silver XRL was demonstrated using the new pump method.

X-ray investigation of Nb/O interfaces

International Nuclear Information System (INIS)

Delheusy, M.

2008-01-01

X-ray free electron lasers and the future International Linear Collider project are based on the performance of niobium superconducting RF cavities for efficient particle acceleration. A remarkable increase of the RF accelerating field is usually achieved by low-temperature annealing of the cavities (T≤150 C, several hours). The microscopic origin of this effect has remained unclear; however, it has been argued that a redistribution of subsurface interstitial oxygen into niobium is involved. In this study, the near surface structure of oxidized niobium single crystals and its evolution upon vacuum annealing has been studied by means of non-destructive in-situ surface sensitive x-ray techniques: x-ray reflectivity (XRR), grazing incidence x-ray diffraction (GIXD), diffuse scattering (GIDXS), crystal truncation rods measurements (CTRs), and high-resolution core-level spectroscopy (HRCLS). A first insight into the interplay between the oxide formation/dissolution and the occurrence of 181 subsurface interstitial oxygen has been given. The natural oxide on Nb(110) and Nb(100) surfaces is constituted of Nb 2 O 5 , NbO 2 and NbO, from the surface to the interface. It reduces progressively upon heating from Nb 2 O 5 to NbO 2 at low temperatures, and to NbO at 300 C. The Nb(110)/NbO(111) interface presents a Nishiyma-Wassermann epitaxial orientation relationship. The depth-distribution of interstitial oxygen has been established indicating that most of the oxygen is located in the direct vicinity of the oxide/niobium interface. No evidence of oxygen depletion below the oxide layer has been observed for the low temperature thermal treatments and surface preparations investigated in this study. (author) [fr

X-ray investigation of Nb/O interfaces

Energy Technology Data Exchange (ETDEWEB)

Delheusy, Melissa

2008-07-07

X-ray free electron lasers and the future International Linear Collider project are based on the performance of niobium superconducting rf cavities for efficient particle acceleration. A remarkable increase of the rf accelerating field is usually achieved by low-temperature annealing of the cavities (T<150 C, several hours). The microscopic origin of this effect has remained unclear; however, it has been argued that a redistribution of subsurface interstitial oxygen into niobium is involved. In this study, the near surface structure of oxidized niobium single crystals and its evolution upon vacuum annealing has been studied by means of non-destructive in-situ surface sensitive X-ray techniques: X-ray reflectivity (XRR), grazing incidence X-ray diffraction (GIXD), diffuse scattering (GIDXS), crystal truncation rods measurements (CTRs), and high-resolution core-level spectroscopy (HRCLS). A first insight into the interplay between the oxide formation/dissolution and the occurrence of subsurface interstitial oxygen has been given. The natural oxide on Nb(110) and Nb(100) surfaces is constituted of Nb{sub 2}O{sub 5}, NbO{sub 2} and NbO, from the surface to the interface. It reduces progressively upon heating from Nb{sub 2}O{sub 5} to NbO{sub 2} at low temperatures, and to NbO at 300 C. The Nb(110)/NbO(111) interface presents a Nishiyama-Wassermann epitaxial orientation relationship. The depth-distribution of interstitial oxygen has been established indicating that most of the oxygen is located in the direct vicinity of the oxide/niobium interface. No evidence of oxygen depletion below the oxide layer has been observed for the low temperature thermal treatments and surface preparations investigated in this study. (orig.)

X-ray and neutron scattering from amorphous diamondlike carbon and hydrocarbon films

International Nuclear Information System (INIS)

Findeisen, E.

1994-10-01

In this report amorphous, diamondlike, carbon and hydrocarbon films are investigated by two different methods, namely, X-ray scattering and a combination of X-ray and neutron reflectivity. As specular reflectivity probes the scattering length density profile of a sample perpendicular to its surface, the combination of X-ray and neutron reflectivity reveals the nuclei density of both carbon and hydrogen separately. This allows to calculate the concentration of hydrogen in the films, which varies in the presented experiments between 0 and 36 atomic %. This method is a new and nondestructive technique to determine the concentration of hydrogen within an error of about ±1 at. % in samples with sharp interfaces. It is well suited for thin diamondlike carbon films. X-ray scattering is used to obtain structural information on the atomic scale, especially the average carbon-carbon distance and the average coordination number of the carbon atoms. As grazing incidence diffraction experiments were not successful, free-standing films are used for the scattering experiments with synchrotron light. However, the scattered intensity for large scattering vectors is, in spite of the intense primary beam, very weak, and therefore the accuracy of the obtained structural parameter is not sufficient to prove the diamondlike properties also on the atomic scale. (au) (10 tabs., 76 ills., 102 refs.)

X-ray characterization of Au-free grown GaAs nanowires on Si

Energy Technology Data Exchange (ETDEWEB)

Biermanns, Andreas; Davydok, Anton; Pietsch, Ullrich [Universitaet Siegen, Festkoerperphysik (Germany); Breuer, Steffen; Geelhaar, Lutz [Paul-Drude-Institut fuer Festkoerperelektronik, Berlin (Germany)

2011-07-01

Semiconductor nanowires (NW) are of particular interest due to the ability to synthesize single-crystalline 1D epitaxial structures and heterostructures in the nanometer range. However, many details of the growth mechanism are not well understood. In this contribution we present a x-ray diffraction study of the early stage of Au-free GaAs nanowire growth on Si(111)-substrates with native oxide using the nano-focus setup available at the ID1 beamline of ESRF. The GaAs NWs were grown by molecular beam epitaxy (MBE), and their formation was induced by Ga droplets. Using a nanometer-sized x-ray beam, size and lattice parameters of individual wires were measured separately. Using asymmetric x-ray diffraction on particular zinc-blende (ZB) and wurtzite (W) sensitive reflections, we show that under the used conditions the NW growth starts with predominantly WZ phases and continues mainly in ZB phase. In addition we can show that the WZ segments of the NWs exhibit a different vertical lattice parameter compared to the zinc-blende segments. A combination of x-ray diffraction from single wires and grazing incidence diffraction shows that the base of the NW is compressively strained along the inplane direction. This strain is released within 20 nm from the substrate-interface.

Plasma-assisted atomic layer epitaxial growth of aluminum nitride studied with real time grazing angle small angle x-ray scattering

Energy Technology Data Exchange (ETDEWEB)

Anderson, Virginia R.; Nepal, Neeraj; Johnson, Scooter D.; Robinson, Zachary R.; Nath, Anindya; Kozen, Alexander C.; Qadri, Syed B.; DeMasi, Alexander; Hite, Jennifer K.; Ludwig, Karl F.; Eddy, Charles R.

2017-05-01

Wide bandgap semiconducting nitrides have found wide-spread application as light emitting and laser diodes and are under investigation for further application in optoelectronics, photovoltaics, and efficient power switching technologies. Alloys of the binary semiconductors allow adjustments of the band gap, an important semiconductor material characteristic, which is 6.2 eV for aluminum nitride (AlN), 3.4 eV for gallium nitride, and 0.7 eV for (InN). Currently, the highest quality III-nitride films are deposited by metalorganic chemical vapor deposition and molecular beam epitaxy. Temperatures of 900 °C and higher are required to deposit high quality AlN. Research into depositing III-nitrides with atomic layer epitaxy (ALEp) is ongoing because it is a fabrication friendly technique allowing lower growth temperatures. Because it is a relatively new technique, there is insufficient understanding of the ALEp growth mechanism which will be essential to development of the process. Here, grazing incidence small angle x-ray scattering is employed to observe the evolving behavior of the surface morphology during growth of AlN by ALEp at temperatures from 360 to 480 °C. Increased temperatures of AlN resulted in lower impurities and relatively fewer features with short range correlations.

Determination of x-ray spectra incident on and transmitted through whole excised breast for improved mammographic exposing technique

International Nuclear Information System (INIS)

Haus, A.G.; Metz, C.E.; Doi, K.; Bernstein, J.

1976-01-01

Measurements were made of x-ray spectra incident on and transmitted through whole excised fresh breast tissue. The spectra and corresponding radiographs show that hardening of the x-ray beam from a molybdenum anode x-ray tube by a 0.5 mm Al filter instead of the conventional 0.03 mm Mo filter allows shorter exposure times and reduces patient radiation exposure. With the Al filter, acceptable image contrast is preserved in mammography of thick or dense breasts

Tests of a grazing-incidence ring resonator free-electron laser

International Nuclear Information System (INIS)

Dowell, D.H.; Laucks, M.L.; Lowrey, A.R.; Adamski, J.L.; Pistoresi, D.J.; Shoffstall, D.R.; Bentz, M.P.; Burns, R.H.; Guha, J.; Sun, K.; Tomita, W.

1991-01-01

This paper reports on the Boeing free-electron laser (FEL) optical cavity that has been changed from a simple concentric cavity using two spherical mirrors to a larger grazing-incidence ring resonator. The new resonator consists of two mirror telescopes located at each end of the wiggler with a round-trip path length of approximately 133 m. Each telescope is a grazing-incidence hyperboloid followed by a normal-incidence paraboloid. Initial tests showed that poorly positioned ring focus and unreliable pointing alignment resulted in reduced and structured FEL output. (First lasing operation occurred on March 23 and 24, 1990.) Later efforts concentrated on improving the resonator alignment techniques and lowering the single-pass losses. FEL performance and reliability have significantly improved due to better ring alignment. The alignment procedure and recent lasing results are described. The effect the electron beam has on lasing is also discussed. Measurements are presented showing how FEL temporal output and wavelength are sensitive to electron beam energy variations

Direct imaging by atomic force microscopy of surface-localized self-assembled monolayers on a cuprate superconductor and surface X-ray scattering analysis of analogous monolayers on the surface of water

DEFF Research Database (Denmark)

Schougaard, Steen B.; Reitzel, Niels; Bjørnholm, Thomas

2007-01-01

A self-assembled monolayer of CF3(CF2)(3)(CH2)(11)NH2 atop the (001) surface of the high-temperature superconductor YBa2Cu3O7-x was imaged by atomic force microscopy (AFM). The AFM images provide direct 2D-structural evidence for the epitaxial 5.5 angstrom square root 2 x root 2R45 degrees unit...... was studied by grazing-incidence X-ray diffraction and specular X-ray reflectivity. Structural differences and similarities between the water-supported and superconductor-localized monolayers are discussed....

Structural study of SiC(0 0 0 1)3x3 surface by surface X-ray diffraction

International Nuclear Information System (INIS)

Aoyama, T.; Akimoto, K.; Ichimiya, A.; Hisada, Y.; Mukainakano, S.; Emoto, T.; Tajiri, H.; Takahashi, T.; Sugiyama, H.; Zhang, X.; Kawata, H.

2003-01-01

Surface structure of 6H-SiC(0 0 0 1)3x3 reconstruction has been studied by grazing incidence X-ray diffraction with synchrotron radiation. We compared the Patterson map obtained from experimental structure factors with calculated Patterson maps estimated from the models that had been proposed. As the result, the calculated Patterson maps of Kulakov et al.'s [Surf. Sci. 346 (1996) 49] and Starke and coworkers' models [Phys. Rev. Lett. 80 (1998) 758; Phys. Rev. B 58 (1998) 10806; Surf. Rev. Lett. 6 (1999) 1129; Appl. Surf. Sci. 162-163 (2000) 9; Phys. Rev. B 62 (2000) 10335] are relatively in good agreement with experimental one. Therefore, we conclude that there is high possibility that either Kulakov et al.'s or Starke and coworkers' models are reasonable as the actual 3x3 structure

Epoxy replication for Wolter x-ray microscope fabrication

International Nuclear Information System (INIS)

Priedhorsky, W.

1981-01-01

An epoxy replica of a test piece designed to simulate a Wolter x-ray microscope geometry showed no loss of x-ray reflectivity or resolution, compared to the original. The test piece was a diamond-turned cone with 1.5 0 half angle. A flat was fly-cut on one side, then super- and conventionally polished. The replica was separated at the 1.5 0 -draft angle, simulating a shallow angle Wolter microscope geometry. A test with 8.34 A x rays at 0.9 0 grazing angle showed a reflectivity of 67% for the replica flat surface, and 70% for the original. No spread of the reflected beam was observed with a 20-arc second wide test beam. This test verifies the epoxy replication technique for production of Wolter x-ray microscopes

Integrated X-ray testing of the electro-optical breadboard model for the XMM reflection grating spectrometer

Energy Technology Data Exchange (ETDEWEB)

Bixler, J.V.; Craig, W.; Decker, T. [Lawrence Livermore National Lab., CA (United States); Aarts, H.; Boggende, T. den; Brinkman, A.C. [Space Research Organization Netherlands, Utrecht (Netherlands); Burkert, W.; Brauninger, H. [Max-Planck Institute fur Extraterrestische Physik, Testanlage (Germany); Branduardi-Raymont, G. [Univ. College London (United Kingdom); Dubbeldam, L. [Space Research Organization Netherlands, Leiden (Netherlands)] [and others

1994-07-12

X-ray calibration of the Electro-Optical Breadboard Model (EOBB) of the XXM Reflection Grating Spectrometer has been carried out at the Panter test facility in Germany. The EOBB prototype optics consisted of a four-shell grazing incidence mirror module followed by an array of eight reflection gratings. The dispersed x-rays were detected by an array of three CCDs. Line profile and efficiency measurements where made at several energies, orders, and geometric configurations for individual gratings and for the grating array as a whole. The x-ray measurements verified that the grating mounting method would meet the stringent tolerances necessary for the flight instrument. Post EOBB metrology of the individual gratings and their mountings confirmed the precision of the grating boxes fabrication. Examination of the individual grating surface`s at micron resolution revealed the cause of anomalously wide line profiles to be scattering due to the crazing of the replica`s surface.

Energy dispersion of x-ray continua in the energy range 9kev to 19kev refraction on Si wafers

International Nuclear Information System (INIS)

Ebel, H.; Streli, C.; Pepponi, G.; Wobrauschek, P.

2000-01-01

Total reflection of x-rays in matter at given grazing incidence angle is characterized by the occurrence of an energy cut-off. Photons with energies greater than the cut-off energy penetrate into matter and are refracted according to a transition from the optically more dense to the optically less dense medium. Since the refractive index depends on photon energy, an energy dispersion of continuous x-radiation is observed. The present investigation is dedicated to the energy dispersion of continuous x-radiation (Mo, 45 kV) by Si wafers. Theory and experimental results are in excellent agreement. (author)

Grain orientation mapping of passivated aluminum interconnect lines with X-ray micro-diffraction

International Nuclear Information System (INIS)

Chang, C.H.; Patel, J.R.; MacDowell, A.A.; Padmore, H.A.; Thompson, A.C.

1998-01-01

A micro x-ray diffraction facility is under development at the Advanced Light Source. Spot sizes are typically about 1-microm size generated by means of grazing incidence Kirkpatrick-Baez focusing mirrors. Photon energy is either white of energy range 6--14 keV or monochromatic generated from a pair of channel cut crystals. Laue diffraction pattern from a single grain in a passivated 2-microm wide bamboo structured Aluminum interconnect line has been recorded. Acquisition times are of the order of seconds. The Laue pattern has allowed the determination of the crystallographic orientation of individual grains along the line length. The experimental and analysis procedure used is described, as is the latest grain orientation result. The impact of x-ray micro-diffraction and its possible future direction are discussed in the context of other developments in the area of electromigration, and other technological problems

Grain orientation mapping of passivated aluminum interconnect lines by x-ray micro-diffraction

International Nuclear Information System (INIS)

Chang, C. H.; Patel, J. R.; MacDowell, A. A.; Padmore, H. A.; Thompson, A. C.

1998-01-01

A micro x-ray diffraction facility is under development at the Advanced Light Source. Spot sizes are typically about 1-μm size generated by means of grazing incidence Kirkpatrick-Baez focusing mirrors. Photon energy is either white of energy range 6-14 keV or monochromatic generated from a pair of channel cut crystals. Laue diffraction pattern from a single grain in a passivated 2-μm wide bamboo structured Aluminum interconnect line has been recorded. Acquisition times are of the order of seconds. The Laue pattern has allowed the determination of the crystallographic orientation of individual grains along the line length. The experimental and analysis procedure used is described, as is the latest grain orientation result. The impact of x-ray micro-diffraction and its possible future direction are discussed in the context of other developments in the area of electromigration, and other technological problems

Applications of synchrotron-based X-ray fluorescence technique in materials science-possibilities at INDUS-2

International Nuclear Information System (INIS)

Tiwari, Manoj K.

2016-01-01

X-ray fluorescence (XRF) spectroscopy has seen remarkable progress over the last few decades. Numerous applications in basic and applied sciences demonstrate its importance. Various advantages of XRF technique have motivated us to construct a microfocus XRF beamline (BL-16) on Indus-2 national synchrotron radiation facility. The BL-16 beamline offers a wide range of usages - both from research laboratories and industries; and for researchers working in diverse fields. Apart from the fields of pure sciences like physics and chemistry, the beamline provides an attractive platform to exercise material science applications, interdisciplinary applied sciences like medical, forensic and environmental studies etc. In addition to micro-XRF characterization, BL-16 beamline allows a user to perform studies using other advanced synchrotron based experimental methodologies, viz; grazing incidence X-ray fluorescence (GIXRF) analysis, chemical speciation, near-edge absorption spectroscopy and X-ray reflectivity studies of thin layered materials etc. The combined XRR-GIXRF analysis feature of the BL-16 beamline offers a novel capability to perform GIXRF assisted depth resolved X-ray studies to investigate chemical state and electronic structure of the thin nano-structured materials. The design aspects and various salient features of the BL-16 beamline X-ray reflectometer will be presented along with the measured performance. (author)

Structure in defocused beams of x-ray mirrors: causes and possible solutions

Science.gov (United States)

Sutter, John P.; Alcock, Simon G.; Rust, Fiona; Wang, Hongchang; Sawhney, Kawal

2014-09-01

Grazing incidence mirrors are now a standard optic for focusing X-ray beams. Both bimorph and mechanically bendable mirrors are widely used at Diamond Light Source because they permit a wide choice of focal lengths. They can also be deliberately set out of focus to enlarge the X-ray beam, and indeed many beamline teams now wish to generate uniform beam spots of variable size. However, progress has been slowed by the appearance of fine structure in these defocused beams. Measurements showing the relationship between the medium-frequency polishing error and this structure over a variety of beam sizes will be presented. A theoretical model for the simulations of defocused beams from general mirrors will then be developed. Not only the figure error and its first derivative the slope error, but also the second derivative, the curvature error, must be considered. In conclusion, possible ways to reduce the defocused beam structure by varying the actuators' configuration and settings will be discussed.

X-ray diffraction studies of the structure and orientations of thiophene and fluorenone based molecule

International Nuclear Information System (INIS)

Porzio, William; Pasini, Mariacecilia; Destri, Silvia; Giovanella, Umberto; Fontaine, Philippe

2006-01-01

The crystal structure of a conjugated molecule containing thiophene and fluorenone residues has been determined from powder X-ray diffraction (XRD). Thin films ( -5 Pa) onto oxidized silicon substrates, are oriented along with different crystallographic directions. A comparison of XRD in both Grazing Incidence and Bragg-Brentano geometries allowed to perform a quantitative analysis of the various orientations. This approach is generally applicable in the case of multi-oriented films. The results fully account for the poor performance of this molecule in p-type field effect transistor devices

Femtosecond X-ray magnetic circular dichroism absorption spectroscopy at an X-ray free electron laser

Energy Technology Data Exchange (ETDEWEB)

Higley, Daniel J., E-mail: dhigley@stanford.edu; Yuan, Edwin [SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, California 94025 (United States); Department of Applied Physics, Stanford University, Stanford, California 94305 (United States); Hirsch, Konstantin; Dakovski, Georgi L.; Jal, Emmanuelle; Lutman, Alberto A.; Coslovich, Giacomo; Hart, Philip; Hoffmann, Matthias C.; Mitra, Ankush; Moeller, Stefan; Ohldag, Hendrik; Seaberg, Matthew; Stöhr, Joachim; Nuhn, Heinz-Dieter; Reid, Alex H.; Dürr, Hermann A.; Schlotter, William F. [SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, California 94025 (United States); Liu, Tianmin; MacArthur, James P. [SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, California 94025 (United States); Department of Physics, Stanford University, Stanford, California 94305 (United States); and others

2016-03-15

X-ray magnetic circular dichroism spectroscopy using an X-ray free electron laser is demonstrated with spectra over the Fe L{sub 3,2}-edges. The high brightness of the X-ray free electron laser combined with high accuracy detection of incident and transmitted X-rays enables ultrafast X-ray magnetic circular dichroism studies of unprecedented sensitivity. This new capability is applied to a study of all-optical magnetic switching dynamics of Fe and Gd magnetic sublattices in a GdFeCo thin film above its magnetization compensation temperature.

Confocal total reflection X-ray fluorescence technology based on an elliptical monocapillary and a parallel polycapillary X-ray optics.

Science.gov (United States)

Zhu, Yu; Wang, Yabing; Sun, Tianxi; Sun, Xuepeng; Zhang, Xiaoyun; Liu, Zhiguo; Li, Yufei; Zhang, Fengshou

2018-07-01

A total reflection X-ray fluorescence (TXRF) spectrometer based on an elliptical monocapillary X-ray lens (MXRL) and a parallel polycapillary X-ray lens (PPXRL) was designed. This TXRF instrument has micro focal spot, low divergence and high intensity of incident X-ray beam. The diameter of the focal spot of MXRL was 16.5 µm, and the divergence of the incident X-ray beam was 3.4 mrad. We applied this TXRF instrument to the micro analysis of a single-layer film containing Ni deposited on a Si substrate by metal vapor vacuum arc ion source. Copyright © 2018 Elsevier Ltd. All rights reserved.

Active x-ray optics for high resolution space telescopes

Science.gov (United States)

Doel, Peter; Atkins, Carolyn; Brooks, D.; Feldman, Charlotte; Willingale, Richard; Button, Tim; Rodriguez Sanmartin, Daniel; Meggs, Carl; James, Ady; Willis, Graham; Smith, Andy

2017-11-01

actively controlled grazing incident optics for the next generation of X-ray space telescopes. Currently telescope systems are limited in the resolution and sensitivity by the optical quality of the thin shell optics used. As part of its research programme an actively controlled prototype X-ray thin shell telescope optic of dimensions 30x10cm has been developed to bench test the technology. The design is based on thin nickel shells bonded to shaped piezo-electric unimorph actuators made from lead zirconate titanate (PZT).

2 and 3 dimensional systems studied using x-ray crystallographic techniques

International Nuclear Information System (INIS)

Schultz, T. M.

1998-01-01

Dodecanethiol is known to self assemble on pure Au(111) surfaces. Grazing incidence X-ray diffraction (GIXD) experiments have been performed on this surface under true equilibrium conditions, using an in-situ cell. In addition an extended ex-situ data set of dodecanethiol on gold has been collected. Finally the structure of the cleaved (OOι) surface of benzamide is presented, based on GIXD measurements. Structural models for tetramethylammonium tetrafluoroborate based on rigid body TLX refinements are presented. A comparison between three different data collection methods is carried out and the appearance of a twinned structure at the 158 K phase transition is discussed. The critical temperature of the phase transition is determined. (au)

A zone plate soft x-ray microscope using monochromatized undulator radiation at the beamline NE1B of the TRISTAN Accumulation Ring

International Nuclear Information System (INIS)

Wang, J.; Kagoshima, Y.; Miyahara, T.; Ando, M.; Aoki, S.; Anderson, E.; Attwood, D.; Kern, D.

1995-01-01

A soft x-ray microscope has been developed at the beamline NE1B of the 6.5-GeV TRISTAN Accumulation Ring (AR). It makes use of undulator radiation as its source and a zone plate with the outermost zone width of 50 nm as its imaging element. It has two main features. First, the undulator radiation is monochromatized by a grazing incidence grating monochromator to match to the monochromaticity requirement of the zone plate. Second, a visible light prefocus unit consisting of two objectives has been designed and installed in the x-ray microscope. The x-ray optical system of the microscope can be adjusted easily, quickly, and precisely by using this unit. The microscope can resolve 55-nm lines and spaces in a zone plate test pattern

Determination of line profiles on nano-structured surfaces using EUV and x-ray scattering

Science.gov (United States)

Soltwisch, Victor; Wernecke, Jan; Haase, Anton; Probst, Jürgen; Schoengen, Max; Krumrey, Michael; Scholze, Frank; Pomplun, Jan; Burger, Sven

2014-09-01

Non-imaging techniques like X-ray scattering are supposed to play an important role in the further development of CD metrology for the semiconductor industry. Grazing Incidence Small Angle X-ray Scattering (GISAXS) provides directly assessable information on structure roughness and long-range periodic perturbations. The disadvantage of the method is the large footprint of the X-ray beam on the sample due to the extremely shallow angle of incidence. This can be overcome by using wavelengths in the extreme ultraviolet (EUV) spectral range, EUV small angle scattering (EUVSAS), which allows for much steeper angles of incidence but preserves the range of momentum transfer that can be observed. Generally, the potentially higher momentum transfer at shorter wavelengths is counterbalanced by decreasing diffraction efficiency. This results in a practical limit of about 10 nm pitch for which it is possible to observe at least the +/- 1st diffraction orders with reasonable efficiency. At the Physikalisch-Technische Bundesanstalt (PTB), the available photon energy range extends from 50 eV up to 10 keV at two adjacent beamlines. PTB commissioned a new versatile Ellipso-Scatterometer which is capable of measuring 6" square substrates in a clean, hydrocarbon-free environment with full flexibility regarding the direction of the incident light polarization. The reconstruction of line profiles using a geometrical model with six free parameters, based on a finite element method (FEM) Maxwell solver and a particle swarm based least-squares optimization yielded consistent results for EUV-SAS and GISAXS. In this contribution we present scatterometry data for line gratings and consistent reconstruction results of the line geometry for EUV-SAS and GISAXS.

In situ x-ray scattering studies of the Au(111)/electrolyte interface

International Nuclear Information System (INIS)

Wang, Jia; Ocko, B.M.; Davenport, A.J.; Isaacs, H.S.

1991-01-01

The adsorption of anions at the Au(111) electrode and the subsequent effect on the gold surface structure have been investigated using x-ray specular reflectivity and grazing incident angle diffraction techniques. The top layer of gold atoms undergoes a reversible phase transition between the (1x1) bulk termination and a (23x√ bar 3) reconstructed phase on changing the potential. The shifts of the phase transition potential in NaCland NaBr solutions from the one in NaF can be understood by the anion adsorption induced charge effect. The reconstruction formation rate increases in chloride and bromide solutions due to an increase in the surface mobility with anion adsorption. Adsorbed chloride and bromide monolayers can be monitored during a potential scan by the specular reflectivity

Soft X-ray images of the solar corona using normal incidence optics

Science.gov (United States)

Bruner, M. E.; Haisch, B. M.; Brown, W. A.; Acton, L. W.; Underwood, J. H.

1988-01-01

A solar coronal loop system has been photographed in soft X-rays using a normal incidence telescope based on multilayer mirror technology. The telescope consisted of a spherical objective mirror of 4 cm aperture and 1 m focal length, a film cassette, and a focal plane shutter. A metallized thin plastic film filter was used to exclude visible light. The objective mirror was covered with a multilayer coating consisting of alternating layers of tungsten and carbon whose combined thicknesses satisfied the Bragg diffraction condition for 44 A radiation. The image was recorded during a rocket flight on October 25, 1985 and was dominated by emission lines arising from the Si XII spectrum. The rocket also carried a high resolution soft X-ray spectrograph that confirmed the presence of Si XII line radiation in the source. This image represents the first successful use of multilayer technology for astrophysical observations.

Wavelength dispersive X-ray absorption fine structure imaging by parametric X-ray radiation

International Nuclear Information System (INIS)

Inagaki, Manabu; Sakai, Takeshi; Sato, Isamu; Hayakawa, Yasushi; Nogami, Kyoko; Tanaka, Toshinari; Hayakawa, Ken; Nakao, Keisuke

2008-01-01

The parametric X-ray radiation (PXR) generator system at Laboratory for Electron Beam Research and Application (LEBRA) in Nihon University is a monochromatic and coherent X-ray source with horizontal wavelength dispersion. The energy definition of the X-rays, which depends on the horizontal size of the incident electron beam on the generator target crystal, has been investigated experimentally by measuring the X-ray absorption near edge structure (XANES) spectra on Cu and CuO associated with conventional X-ray absorption imaging technique. The result demonstrated the controllability of the spectrum resolution of XANES by adjusting of the horizontal electron beam size on the target crystal. The XANES spectra were obtained with energy resolution of several eV at the narrowest case, which is in qualitative agreement with the energy definition of the PXR X-rays evaluated from geometrical consideration. The result also suggested that the wavelength dispersive X-ray absorption fine structure measurement associated with imaging technique is one of the promising applications of PXR. (author)

Application of in-plane x-ray diffraction technique for residual stress measurement of TiN film/WC-Co alloy

International Nuclear Information System (INIS)

Takago, Shigeki; Yasui, Haruyuki; Awazu, Kaoru; Sasaki, Toshihiko; Hirose, Yukio; Sakurai, Kenji

2006-01-01

An in-plane X-ray diffraction technique was used to measure the residual stress of a CVD (chemical vapor deposition) TiN-coated WC-Co alloy. We could obtain the diffraction pattern from a thin film layer, eliminating that of the substrate. In the case of a conventional X-ray diffractometer, the X-ray penetration depth is about few μm. However, for a grazing incidence beam it is only 0.2μm. Depth profiles of residual stress in TiN film layer were evaluated by the present method and the conventional sin 2 ψ technique. We concluded that the in-plane diffraction technique enables us to determine the residual stress in a DVD-TiN film having an oriented texture. It was found that the residual tensile stress generated a mismatch of the coefficient of thermal expansion between the film and the substrate. (author)

Application of in-plane x-ray diffraction technique for residual stress measurement of TiN film/WC-Co alloy

Energy Technology Data Exchange (ETDEWEB)

Takago, Shigeki; Yasui, Haruyuki; Awazu, Kaoru [Industrial Research Inst. of Ishikawa, Kanazawa, Ishikawa (Japan); Sasaki, Toshihiko; Hirose, Yukio [Kanazawa Univ., Dept. of Materials Science and Engineering, Kanazawa, Ishikawa (Japan); Sakurai, Kenji [National Inst. for Materials Science, Tsukuba, Ibaraki (Japan)

2006-06-15

An in-plane X-ray diffraction technique was used to measure the residual stress of a CVD (chemical vapor deposition) TiN-coated WC-Co alloy. We could obtain the diffraction pattern from a thin film layer, eliminating that of the substrate. In the case of a conventional X-ray diffractometer, the X-ray penetration depth is about few {mu}m. However, for a grazing incidence beam it is only 0.2{mu}m. Depth profiles of residual stress in TiN film layer were evaluated by the present method and the conventional sin{sup 2}{psi} technique. We concluded that the in-plane diffraction technique enables us to determine the residual stress in a DVD-TiN film having an oriented texture. It was found that the residual tensile stress generated a mismatch of the coefficient of thermal expansion between the film and the substrate. (author)

The Focusing Optics X-ray Solar Imager Small Explorer Concept Mission

Science.gov (United States)

Christe, Steven; Shih, Albert Y.; Dennis, Brian R.; Glesener, Lindsay; Krucker, Sam; Saint-Hilaire, Pascal; Gubarev, Mikhail; Ramsey, Brian

2016-05-01

We present the FOXSI (Focusing Optics X-ray Solar Imager) small explorer (SMEX) concept, a mission dedicated to studying particle acceleration and energy release on the Sun. FOXSI is designed as a 3-axis stabilized spacecraft in low-Earth orbit making use of state-of-the-art grazing incidence focusing optics combined withpixelated solid-state detectors, allowing for direct imaging of solar X-rays. The current design being studied features multiple telescopes with a 14 meter focal length enabled by a deployable boom.FOXSI will observe the Sun in the 3-100 keV energy range. The FOXSI imaging concept has already been tested on two sounding rocket flights, in 2012 and 2014 and on the HEROES balloon payload flight in 2013. FOXSI will image the Sun with an angular resolution of 5'', a spectral resolution of 0.5 keV, and sub-second temporal resolution. FOXSI is a direct imaging spectrometer with high dynamic range and sensitivity and will provide a brand-new perspective on energy release on the Sun. We describe the mission and its science objectives.

PREFACE: Exploring surfaces and buried interfaces of functional materials by advanced x-ray and neutron techniques Exploring surfaces and buried interfaces of functional materials by advanced x-ray and neutron techniques

Science.gov (United States)

Sakurai, Kenji

2010-12-01

updates on recent progress and global trends in the field. We planned to cover quite a wide area of surface and buried interface science with x-rays and neutrons. Following a great deal of discussion during the editing process, we have decided to change direction. As we intend to publish similar special issues on a frequent basis, we will not insist on editing this issue as systematic and complete collections of research. Many authors decided to write an ordinary research paper rather than an article including systematic accounts. Due to this change in policy, some authors declined to contribute, and the number of papers is now just 12. However, readers will find that the special issue gives an interesting collection of new original research in surface and buried interface studies with x-rays and neutrons. The 12 papers cover the following research topics: (1) polymer analysis by diffuse scattering; (2) discussion of the electrochemical solid--liquid interface by synchrotron x-ray diffraction; (3) analysis of capped nanodots by grazing incidence small-angle x-ray scattering (GISAXS); (4) discussion of the strain distribution in silicon by high-resolution x-ray diffraction; (5) study of mesoporous structures by a combination of x-ray reflectivity and GISAXS; (6) discussion of energy-dispersive x-ray reflectometry and its applications; (7) neutron reflectivity studies on hydrogen terminated silicon interface; (8) the fabrication and performance of a special mirror for water windows; (9) depth selective analysis by total-reflection x-ray diffraction; (10) nanoparticle thin films prepared by a gas deposition technique; (11) discussion of crystal truncation rod (CTR) scattering of semiconductor nanostructures; (12) magnetic structure analysis of thin films by polarized neutron reflectivity. While not discussed in the present special issue, x-ray and neutron techniques have made great progress. The most important steps forward have been in 2D/3D real-space imaging, and realtime

The effects of Pretreatment with stomach extract on the incidence of x-ray-induced gastric tumor in ICR mice

International Nuclear Information System (INIS)

Watanabe, Hiromitsu; Naito, Masashi; Kawashima, Kengo; Ito, Akihiro

1984-01-01

The effect of crude stomach extracts (CSE) on X-ray-induced gastric tumorigenesis was examined. ICR mice were treated with two or four administrations of CSE at one-week intervals then irradiated with 20 Gy of X-rays one week after the final CSE administration. Unexpectedly, the incidence of X-ray-induced tumors was not significantly altered by two CSE pretreatments but was markedly reduced by four CSE pretreatments. Similarly, erosion and squamous metaplasia produced in the glandular stomach a week after X-irradiation were markedly diminished by four CSE pretreatments but not by two CSE pretreatments. (author)

Grazing incidence beam expander

Energy Technology Data Exchange (ETDEWEB)

Akkapeddi, P.R.; Glenn, P.; Fuschetto, A.; Appert, Q.; Viswanathan, V.K.

1985-01-01

A Grazing Incidence Beam Expander (GIBE) telescope is being designed and fabricated to be used as an equivalent end mirror in a long laser resonator cavity. The design requirements for this GIBE flow down from a generic Free Electron Laser (FEL) resonator. The nature of the FEL gain volume (a thin, pencil-like, on-axis region) dictates that the output beam be very small. Such a thin beam with the high power levels characteristic of FELs would have to travel perhaps hundreds of meters or more before expanding enough to allow reflection from cooled mirrors. A GIBE, on the other hand, would allow placing these optics closer to the gain region and thus reduces the cavity lengths substantially. Results are presented relating to optical and mechanical design, alignment sensitivity analysis, radius of curvature analysis, laser cavity stability analysis of a linear stable concentric laser cavity with a GIBE. Fabrication details of the GIBE are also given.

Response of the 'patient dose calibrator' chamber for incident positions and sizes of X-ray fields

International Nuclear Information System (INIS)

Oliveira, Cassio M.; Abrantes, Marcos Eugenio S.; Ferreira, Flavia C. Bastos; Lacerda, Marco A. de Souza; Alonso, Thessa C.; Silva, Teogenes A. da; Oliveira, Paulo Marcio C.

2009-01-01

The evaluation of patient doses is an important tool for optimizing radiodiagnostic medical procedures with conventional X-ray equipment and for improving the quality of the radiographic image. The Patient Dose Calibrator (PDC) chamber is a dosimetric instrument that is used in the evaluation of the air kerma-area product (P KA ) quantity aiming the reduction of patient doses. The objective this work was to study the P KA variation caused by different field incident positions and sizes of the X-ray beam on the PDC chamber. Results showed that the PDC chamber has repeatability lower than 0.6%, beam position dependence of 3% and linearity response within ± 6%; these characteristics are to be taken into account during evaluation of the radiological protection conditions of conventional x-ray equipment. (author)

Calibration of the hard x-ray detectors for the FOXSI solar sounding rocket

Science.gov (United States)

Athiray, P. S.; Buitrago-Casas, Juan Camilo; Bergstedt, Kendra; Vievering, Juliana; Musset, Sophie; Ishikawa, Shin-nosuke; Glesener, Lindsay; Takahashi, Tadayuki; Watanabe, Shin; Courtade, Sasha; Christe, Steven; Krucker, Säm.; Goetz, Keith; Monson, Steven

2017-08-01

The Focusing Optics X-ray Solar Imager (FOXSI) sounding rocket experiment conducts direct imaging and spectral observation of the Sun in hard X-rays, in the energy range 4 to 20 keV. These high-sensitivity observations are used to study particle acceleration and coronal heating. FOXSI is designed with seven grazing incidence optics modules that focus X-rays onto seven focal plane detectors kept at a 2m distance. FOXSI-1 was flown with seven Double-sided Si Strip Detectors (DSSD), and two of them were replaced with CdTe detectors for FOXSI-2. The upcoming FOXSI-3 flight will carry DSSD and CdTe detectors with upgraded optics for enhanced sensitivity. The detectors are calibrated using various radioactive sources. The detector's spectral response matrix was constructed with diagonal elements using a Gaussian approximation with a spread (sigma) that accounts for the energy resolution of the detector. Spectroscopic studies of past FOXSI flight data suggest that the inclusion of lower energy X-rays could better constrain the spectral modeling to yield a more precise temperature estimation of the hot plasma. This motivates us to carry out an improved calibration to better understand the finer-order effects on the spectral response, especially at lower energies. Here we report our improved calibration of FOXSI detectors using experiments and Monte-Carlo simulations.

Measurement of X-ray attenuation coefficients around K-absorption edges using Fe Kα X-rays

International Nuclear Information System (INIS)

Kerur, B.R.; Thontadarya, S.R.; Hanumaiah, B.

1993-01-01

The x-ray mass attenuation coefficients were measured around the K-absorption edges of elements in the range 16 ≤ Z ≤ 30 using Fe Kα x-rays of energy 6.400 keV, which is the weighted average energy of Kα 1 and Kα 2 x-ray components from the 57 Co radioactive source. Kβ x-rays were almost eliminated by the differential absorption technique. The small difference in energy between Kα 1 and Kα 2 , 13 eV, was shown to be inconsequential by comparing the measured and theoretical values of μ/ρ for standard materials such as Al, Cu, Mo and Ta. The effect of fine structure of the K-absorption edge on μ/ρ was elucidated by using the compounds of elements in the range 16 ≤ X ≤ 30, containing one element with its K-absorption edge energy (E k ) close to the incident photon energy (E x ). The results clearly indicate the validity of the theoretical mixture rule for all those compounds whose K edge is far away from the incident energy but show deviations of as much as 10% for the manganese compound whose K edge is 140 eV above E x and about 12% for the chromium compound whose K edge is 410 eV below E x . These deviations are attributed to the possible influence of resonance Raman scattering when the incident photon energy E x is less than the edge and to the influence of EXAFS when E x is more than the edge energy. (Author)

Laser-pump/X-ray-probe experiments with electrons ejected from a Cu(111) target: space-charge acceleration.

Science.gov (United States)

Schiwietz, G; Kühn, D; Föhlisch, A; Holldack, K; Kachel, T; Pontius, N

2016-09-01

A comprehensive investigation of the emission characteristics for electrons induced by X-rays of a few hundred eV at grazing-incidence angles on an atomically clean Cu(111) sample during laser excitation is presented. Electron energy spectra due to intense infrared laser irradiation are investigated at the BESSY II slicing facility. Furthermore, the influence of the corresponding high degree of target excitation (high peak current of photoemission) on the properties of Auger and photoelectrons liberated by a probe X-ray beam is investigated in time-resolved pump and probe measurements. Strong electron energy shifts have been found and assigned to space-charge acceleration. The variation of the shift with laser power and electron energy is investigated and discussed on the basis of experimental as well as new theoretical results.

Micro-fresnel structures for microscopy of laser generated bright x-ray sources

International Nuclear Information System (INIS)

Ceglio, N.M.; Shavers, D.C.; Flanders, D.C.; Smith, H.I.

1979-01-01

A brief parametric survey of the x-ray characteristics of a gold micro-disk irradiated at 3 x 10 14 watt/cm 2 by a 1 nsec Nd-glass laser pulse has been provided as an example of a laser generated bright x-ray source. It was shown that a simple phenomenological model of the laser generated x-ray source as a microscopic equilibrium plasma radiating as a blackbody for a finite time determined by its hydrodynamic disassembly and radiation losses, serves to provide an adequate approximation to the x-ray characteristics of such sources. The current state of x-ray microscopy within the LLL laser fusion program was briefly reviewed. Kirpatrick--Baez grazing incidence reflection x-ray microscopes are being used to provide 3 to 5 μm resolution, broadband images (ΔE/E approx. 0.3) over a spectral range from .6 keV to 3.5 keV. Zone Plate Coded Imaging is used to provide 5 to 10 μm resolution, broadband (ΔE/E approx. 0.5) images over a spectral range from 3 keV to 50 keV. Efficient x-ray lensing elements with anticipated submicron resolution are being developed for narrowband (ΔE/E approx. 10 -2 ) imaging applications over a spectral range .1 keV to 8 keV. The x-ray lens design is that of a transmission blazed Fresnel phase plate. Micro--Fresnel zone plates with 3200 A minimum linewidth have been fabricated and preliminary resolution tests begun. The first resolution test pattern, having minimum linewidth of 2.5 μm, was imaged in lambda = 8.34 A light with no difficulty. Newer test patterns with submicron minimum line are being prepared for the next stage of resolution testing. An off-axis Fresnel zone plate with 1600 A minimum linewidth is presently being fabricated for use as an imaging spectrometer in order to provide spatially separated, chromatically distinct images of characteristic line emissions from laser fusion targets

Recent Progress in Adjustable X-ray Optics for Astronomy

Science.gov (United States)

Reid, Paul B.; Allured, Ryan; Cotroneo, Vincenzo; McMuldroch, Stuart; Marquez, Vanessa; Schwartz, Daniel A.; Vikhlinin, Alexey; ODell, Stephen L.; Ramsey, Brian; Trolier-McKinstry, Susan;

X-ray imaging system

International Nuclear Information System (INIS)

Houston, J.M.

1980-01-01

A novel, high-speed apparatus for use in X-ray computerised tomography is described in detail. It consists of a semi-circular array of X-ray sources, collimators and an ion chamber array for detection of the X-rays. The X-ray sources may be pulsed in salvos such that the corresponding detectors in the array are only illuminated by one source. The use of computer controlled salvos speeds up the image processing by at least a factor of two. The ion chamber array is designed to have a constant detection efficiency for varying angles of X-ray incidence. A detailed description of the detector construction and suggested gaseous fillings are given. It is claimed that the present tomographic system allows fast and accurate imaging of internal body organs and is insensitive to the blurring effects which motion of these organs tends to produce. (UK)

Imaging X-Ray Polarimetry Explorer Mission Attitude Determination and Control Concept

Science.gov (United States)

Bladt, Jeff; Deininger, William D.; Kalinowski, William C.; Boysen, Mary; Bygott, Kyle; Guy, Larry; Pentz, Christina; Seckar, Chris; Valdez, John; Wedmore, Jeffrey;

Tomosynthesis can facilitate accurate measurement of joint space width under the condition of the oblique incidence of X-rays in patients with rheumatoid arthritis.

Science.gov (United States)

Ono, Yohei; Kashihara, Rina; Yasojima, Nobutoshi; Kasahara, Hideki; Shimizu, Yuka; Tamura, Kenichi; Tsutsumi, Kaori; Sutherland, Kenneth; Koike, Takao; Kamishima, Tamotsu

2016-06-01

Accurate evaluation of joint space width (JSW) is important in the assessment of rheumatoid arthritis (RA). In clinical radiography of bilateral hands, the oblique incidence of X-rays is unavoidable, which may cause perceptional or measurement error of JSW. The objective of this study was to examine whether tomosynthesis, a recently developed modality, can facilitate a more accurate evaluation of JSW than radiography under the condition of oblique incidence of X-rays. We investigated quantitative errors derived from the oblique incidence of X-rays by imaging phantoms simulating various finger joint spaces using radiographs and tomosynthesis images. We then compared the qualitative results of the modified total Sharp score of a total of 320 joints from 20 patients with RA between these modalities. A quantitative error was prominent when the location of the phantom was shifted along the JSW direction. Modified total Sharp scores of tomosynthesis images were significantly higher than those of radiography, that is to say JSW was regarded as narrower in tomosynthesis than in radiography when finger joints were located where the oblique incidence of X-rays is expected in the JSW direction. Tomosynthesis can facilitate accurate evaluation of JSW in finger joints of patients with RA, even with oblique incidence of X-rays. Accurate evaluation of JSW is necessary for the management of patients with RA. Through phantom and clinical studies, we demonstrate that tomosynthesis may achieve more accurate evaluation of JSW.

Sample analysis using gamma ray induced fluorescent X-ray emission

Energy Technology Data Exchange (ETDEWEB)

Sood, B S; Allawadhi, K L; Gandhi, R; Batra, O P; Singh, N [Punjabi Univ., Patiala (India). Nuclear Science Labs.

1983-01-01

A non-destructive method for the analysis of materials using gamma ray-induced fluorescent x-ray emission has been developed. In this method, special preparation of very thin samples in which the absorption of the incident gamma rays and the emitted fluorescent x-rays is negligible, is not needed, and the absorption correction is determined experimentally. A suitable choice of the incident gamma ray energies is made to minimise enhancement effects through selective photoionization of the elements in the sample. The method is applied to the analysis of a typical sample of the soldering material using 279 keV and 59.5 keV gamma rays from /sup 203/Hg and /sup 241/Am radioactive sources respectively. The results of the analysis are found to agree well with those obtained from the chemical analysis.

Innovative diffraction gratings for high-resolution resonant inelastic soft x-ray scattering spectroscopy

International Nuclear Information System (INIS)

Voronov, D.L.; Warwick, T.; Gullikson, E. M.; Salmassi, F.; Padmore, H. A.

2016-01-01

High-resolution Resonant Inelastic X-ray Scattering (RIXS) requires diffraction gratings with very exacting characteristics. The gratings should provide both very high dispersion and high efficiency which are conflicting requirements and extremely challenging to satisfy in the soft x-ray region for a traditional grazing incidence geometry. To achieve high dispersion one should increase the groove density of a grating; this however results in a diffraction angle beyond the critical angle range and results in drastic efficiency loss. The problem can be solved by use of multilayer coated blazed gratings (MBG). In this work we have investigated the diffraction characteristics of MBGs via numerical simulations and have developed a procedure for optimization of grating design for a multiplexed high resolution imaging spectrometer for RIXS spectroscopy to be built in sector 6 at the Advanced Light Source (ALS). We found that highest diffraction efficiency can be achieved for gratings optimized for 4"t"h or 5"t"h order operation. Fabrication of such gratings is an extremely challenging technological problem. We present a first experimental prototype of these gratings and report its performance. High order and high line density gratings have the potential to be a revolutionary new optical element that should have great impact in the area of soft x-ray RIXS.

Film thickness determination by grazing incidence diffraction

Energy Technology Data Exchange (ETDEWEB)

Battiston, G A; Gerbasi, R [CNR, Padua (Italy). Istituto di Chimica e Tecnologie Inorganiche e dei Materiali Avanzati

1996-09-01

Thin films deposited via MOCVD (Metal Organic Chemical Vapour Deposition) are layers in the thickness range of a few manometers to about ten micrometers. An understanding of the physics and chemistry of films is necessary for a better comprehension of the phenomena involved in the film deposition procedure and its optimisation. Together with the crystalline phase a parameter that must be determined is the thickness of the layer. In this work the authors present a method for the measurement of the film thickness. This procedure, based on diffraction intensity absorption of the X-rays, both incident and diffracted in passing through the layers, resulted quite simple, rapid and non-destructive.

Film thickness determination by grazing incidence diffraction

International Nuclear Information System (INIS)

Battiston, G. A.; Gerbasi, R.

1996-01-01

Thin films deposited via MOCVD (Metal Organic Chemical Vapour Deposition) are layers in the thickness range of a few manometers to about ten micrometers. An understanding of the physics and chemistry of films is necessary for a better comprehension of the phenomena involved in the film deposition procedure and its optimisation. Together with the crystalline phase a parameter that must be determined is the thickness of the layer. In this work the authors present a method for the measurement of the film thickness. This procedure, based on diffraction intensity absorption of the X-rays, both incident and diffracted in passing through the layers, resulted quite simple, rapid and non-destructive

Glancing-incidence X-ray diffraction of Ag nanoparticles in gold lustre decoration of Italian Renaissance pottery

Energy Technology Data Exchange (ETDEWEB)

Bontempi, E.; Colombi, P.; Depero, L.E. [Universita di Brescia, Laboratorio di Chimica per le Tecnologie and INSTM, Brescia (Italy); Cartechini, L. [Universita di Perugia, Istituto di Scienze e Tecnologie Molecolari-CNR, Sezione di Perugia, Perugia (Italy); Presciutti, F.; Brunetti, B.G. [Universita di Perugia, INSTM and Centro di Eccellenza SMAArt, Dipartimento di Chimica, Perugia (Italy); Sgamellotti, A. [Universita di Perugia, Istituto di Scienze e Tecnologie Molecolari-CNR, Sezione di Perugia, Perugia (Italy); Universita di Perugia, INSTM and Centro di Eccellenza SMAArt, Dipartimento di Chimica, Perugia (Italy)

2006-06-15

Lustre is known as one of the most significant decorative techniques of Medieval and Renaissance pottery in the Mediterranean basin, characterized by brilliant gold and red metallic reflections and iridescence effects. Previous studies by various techniques (SEM-EDS and TEM, UV-VIS, XRF, RBS and EXAFS) demonstrated that lustre consists of a heterogeneous metal-glass composite film, formed by Cu and Ag nanoparticles dispersed within the outer layer of a tin-opacified lead glaze. In the present work the investigation of an original gold lustre sample from Deruta has been carried out by means of glancing-incidence X-ray diffraction techniques (GIXRD). The study was aimed at providing information on structure and depth distribution of Ag nanoparticles. Exploiting the capability of controlling X-ray penetration in the glaze by changing the incidence angle, we used GIXRD measurements to estimate non-destructively thickness and depth of silver particles present in the first layers of the glaze. (orig.)

Glancing-incidence X-ray diffraction of Ag nanoparticles in gold lustre decoration of Italian Renaissance pottery

International Nuclear Information System (INIS)

Bontempi, E.; Colombi, P.; Depero, L.E.; Cartechini, L.; Presciutti, F.; Brunetti, B.G.; Sgamellotti, A.

2006-01-01

Lustre is known as one of the most significant decorative techniques of Medieval and Renaissance pottery in the Mediterranean basin, characterized by brilliant gold and red metallic reflections and iridescence effects. Previous studies by various techniques (SEM-EDS and TEM, UV-VIS, XRF, RBS and EXAFS) demonstrated that lustre consists of a heterogeneous metal-glass composite film, formed by Cu and Ag nanoparticles dispersed within the outer layer of a tin-opacified lead glaze. In the present work the investigation of an original gold lustre sample from Deruta has been carried out by means of glancing-incidence X-ray diffraction techniques (GIXRD). The study was aimed at providing information on structure and depth distribution of Ag nanoparticles. Exploiting the capability of controlling X-ray penetration in the glaze by changing the incidence angle, we used GIXRD measurements to estimate non-destructively thickness and depth of silver particles present in the first layers of the glaze. (orig.)

Glancing-incidence X-ray diffraction of Ag nanoparticles in gold lustre decoration of Italian Renaissance pottery

Science.gov (United States)

Bontempi, E.; Colombi, P.; Depero, L. E.; Cartechini, L.; Presciutti, F.; Brunetti, B. G.; Sgamellotti, A.

2006-06-01

Lustre is known as one of the most significant decorative techniques of Medieval and Renaissance pottery in the Mediterranean basin, characterized by brilliant gold and red metallic reflections and iridescence effects. Previous studies by various techniques (SEM-EDS and TEM, UV-VIS, XRF, RBS and EXAFS) demonstrated that lustre consists of a heterogeneous metal-glass composite film, formed by Cu and Ag nanoparticles dispersed within the outer layer of a tin-opacified lead glaze. In the present work the investigation of an original gold lustre sample from Deruta has been carried out by means of glancing-incidence X-ray diffraction techniques (GIXRD). The study was aimed at providing information on structure and depth distribution of Ag nanoparticles. Exploiting the capability of controlling X-ray penetration in the glaze by changing the incidence angle, we used GIXRD measurements to estimate non-destructively thickness and depth of silver particles present in the first layers of the glaze.

Women and x-rays

Energy Technology Data Exchange (ETDEWEB)

Dunkley, P A; Stewart, J H

1976-01-01

When a woman comes to an X-Ray Department it is usually necessary to know the present stage of her menstrual cycle. X-Rays may have an adverse effect on the embryo, especially in early pregnancy. However, exposure to X-Rays at any stage may be associated with a slightly increased incidence of malignant disease in childhood. The International Commission on Radiological Protection recommends that in women of child-bearing age (in some cases as young as 11 years), non-urgent diagnostic radiography be confined to the preovulatory phase of the menstrual cycle: that is, 14 days following the first day of the last menstrual period.

High Reflectance Nanoscale V/Sc Multilayer for Soft X-ray Water Window Region.

Science.gov (United States)

Huang, Qiushi; Yi, Qiang; Cao, Zhaodong; Qi, Runze; Loch, Rolf A; Jonnard, Philippe; Wu, Meiyi; Giglia, Angelo; Li, Wenbin; Louis, Eric; Bijkerk, Fred; Zhang, Zhong; Wang, Zhanshan

2017-10-10

V/Sc multilayer is experimentally demonstrated for the first time as a high reflectance mirror for the soft X-ray water window region. It primarily works at above the Sc-L edge (λ = 3.11 nm) under near normal incidence while a second peak appears at above the V-L edge (λ = 2.42 nm) under grazing incidence. The V/Sc multilayer fabricated with a d-spacing of 1.59 nm and 30 bilayers has a smaller interface width (σ = 0.27 and 0.32 nm) than the conventional used Cr/Sc (σ = 0.28 and 0.47 nm). For V/Sc multilayer with 30 bilayers, the introduction of B 4 C barrier layers has little improvement on the interface structure. As the number of bilayers increasing to 400, the growth morphology and microstructure of the V/Sc layers evolves with slightly increased crystallization. Nevertheless, the surface roughness remains to be 0.25 nm. A maximum soft X-ray reflectance of 18.4% is measured at λ = 3.129 nm at 9° off-normal incidence using the 400-bilayers V/Sc multilayer. According to the fitted model, an s-polarization reflectance of 5.2% can also be expected at λ = 2.425 nm under 40° incidence. Based on the promising experimental results, further improvement of the reflectance can be achieved by using a more stable deposition system, exploring different interface engineering methods and so on.

Toward a soft x-ray Fourier-transform spectrometer

International Nuclear Information System (INIS)

Howells, M.R.; Frank, K.; Hussain, Z.; Moler, E.J.; Reich, T.; Moeller, D.

1993-01-01

The use of Fourier transform spectroscopy (FTS) in the soft x-ray region is advocated as a possible route to spectral resolution superior to that attainable with a grating system. A technical plan is described for applying FTS to the study of the absorption spectrum of helium in the region of double ionization around 60--80 eV. The proposed scheme includes a Mach-Zehnder interferometer deformed into a rhombus shape to provide grazing incidence reflections. The path difference between the interfering beams is to be tuned by translation of a table carrying four mirrors over a range ±1 cm which, in the absence of errors generating relative tilts of the wave fronts, would provide a resolving power equal to the number of waves of path difference: half a million at 65 eV, for example. The signal-to-noise ratio of the spectrum is analyzed and for operation on an Advanced Light Source bending magnet beam line should be about 330

LabVIEW interface with Tango control system for a multi-technique X-ray spectrometry IAEA beamline end-station at Elettra Sincrotrone Trieste

Energy Technology Data Exchange (ETDEWEB)

Wrobel, P.M. [Physics Section, Nuclear Science and Instrumentation Laboratory (NSIL), IAEA Laboratories, A-2444 Seibersdorf (Austria); AGH University of Science and Technology, Faculty of Physics and Applied Computer Science, al. A. Mickiewicza 30, 30-059 Krakow (Poland); Bogovac, M. [Physics Section, Nuclear Science and Instrumentation Laboratory (NSIL), IAEA Laboratories, A-2444 Seibersdorf (Austria); Sghaier, H. [Physics Section, Nuclear Science and Instrumentation Laboratory (NSIL), IAEA Laboratories, A-2444 Seibersdorf (Austria); Institut Superieur d’Informatique et de Mathematiques de Monastir (ISIMM), Departement de technologie, 5000 Monastir (Tunisia); Leani, J.J. [Physics Section, Nuclear Science and Instrumentation Laboratory (NSIL), IAEA Laboratories, A-2444 Seibersdorf (Austria); IFEG – CONICET, Facultad de Matematica Astronomia y Fisica, Universidad Nacional de Cordoba, 5000 Cordoba (Argentina); Migliori, A.; Padilla-Alvarez, R. [Physics Section, Nuclear Science and Instrumentation Laboratory (NSIL), IAEA Laboratories, A-2444 Seibersdorf (Austria); Czyzycki, M. [Physics Section, Nuclear Science and Instrumentation Laboratory (NSIL), IAEA Laboratories, A-2444 Seibersdorf (Austria); AGH University of Science and Technology, Faculty of Physics and Applied Computer Science, al. A. Mickiewicza 30, 30-059 Krakow (Poland); Osan, J. [Physics Section, Nuclear Science and Instrumentation Laboratory (NSIL), IAEA Laboratories, A-2444 Seibersdorf (Austria); Environmental Physics Department, Hungarian Academy of Sciences Centre for Energy Research, Konkoly-Thege M. út 29-33., H-1121 Budapest (Hungary); Kaiser, R.B. [Physics Section, Nuclear Science and Instrumentation Laboratory (NSIL), IAEA Laboratories, A-2444 Seibersdorf (Austria); and others

2016-10-11

A new synchrotron beamline end-station for multipurpose X-ray spectrometry applications has been recently commissioned and it is currently accessible by end-users at the XRF beamline of Elettra Sincrotrone Trieste. The end-station consists of an ultra-high vacuum chamber that includes as main instrument a seven-axis motorized manipulator for sample and detectors positioning, different kinds of X-ray detectors and optical cameras. The beamline end-station allows performing measurements in different X-ray spectrometry techniques such as Microscopic X-Ray Fluorescence analysis (µXRF), Total Reflection X-Ray Fluorescence analysis (TXRF), Grazing Incidence/Exit X-Ray Fluorescence analysis (GI-XRF/GE-XRF), X-Ray Reflectometry (XRR), and X-Ray Absorption Spectroscopy (XAS). A LabVIEW Graphical User Interface (GUI) bound with Tango control system consisted of many custom made software modules is utilized as a user-friendly tool for control of the entire end-station hardware components. The present work describes this advanced Tango and LabVIEW software platform that utilizes in an optimal synergistic manner the merits and functionality of these well-established programming and equipment control tools. - Highlights: • A new methodology for control of a synchrotron beamline end-station is shown. • The new control system comprises a novel binding of Tango control system with LabVIEW interface. • The reliability of the control system is demonstrated by examples of analytical applications.

Recent developments in x-ray laser research at LLE

International Nuclear Information System (INIS)

Boehly, T.; Yaakobi, B.; Craxton, R.S.; Epstein, R.; Richardson, M.C.; Russotto, M.; Soures, J.M.; Wang, J.

1989-01-01

The authors present results and analysis of recent experiments using multiple-foil target designs for a collisional excitation x-ray laser in Ne-like nickel and germanium. These targets, which are designed to yield higher gains than single-exploding-foil targets, are irradiated by 600 ps pulses of 351 nm light in a single 18-mm line from GDL. The lasing lines at --230 A are observed with a 1-m grazing incidence grating spectrometer. They discuss the relative merit of different pump-laser wavelengths and present experimental results for three wavelengths: 1.06 μm, 527 nm, and 351 nm. They present plans for the conversion of the GDL laser to a --100 J - 10 ps laser (10 TW) which will be used for producing a recombinationally pumped laser in Al which is predicted to lase at 39 A. Results of computer simulation of these proposed experiments are presented

Multilayer optics for monochromatic high-resolution X-ray imaging diagnostic in a broad photon energy range from 2 keV to 22 keV

International Nuclear Information System (INIS)

Troussel, Ph.; Dennetiere, D.; Maroni, R.; Høghøj, P.; Hedacq, S.; Cibik, L.; Krumrey, M.

2014-01-01

The “Commissariat à l’énergie atomique et aux énergies alternatives” (CEA) studies and designs advanced X-ray diagnostics to probe dense plasmas produced at the future Laser MegaJoule (LMJ) facility. Mainly for X-ray imaging with high spatial resolution, different types of multilayer mirrors were developed to provide broadband X-ray reflectance at grazing incidence. These coatings are deposited on two toroidal mirror substrates that are then mounted into a Wolter-type geometry (working at a grazing angle of 0.45°) to realize an X-ray microscope. Non-periodic (depth graded) W/Si multilayer can be used in the broad photon energy range from 2 keV to 22 keV. A third flat mirror can be added for the spectral selection of the microscope. This mirror is coated with a Mo/Si multilayer for which the d-spacing varies in the longitudinal direction to satisfy the Bragg condition within the angular acceptance of the microscope and also to compensate the angular dispersion due to the field of the microscope. We present a study of such a so-called Göbel mirror which was optimized for photon energy of 10.35 keV. The three mirrors were coated using magnetron sputtering technology by Xenocs SA. The reflectance in the entire photon energy range was determined in the laboratory of the Physikalisch-Technische Bundesanstalt (PTB) at the synchrotron radiation facility BESSY II in Berlin

Multilayer optics for monochromatic high-resolution X-ray imaging diagnostic in a broad photon energy range from 2 keV to 22 keV

Energy Technology Data Exchange (ETDEWEB)

Troussel, Ph., E-mail: philippe.troussel@cea.fr [CEA, DAM, DIF, F-91297 Arpajon (France); Dennetiere, D. [Synchrotron Soleil, L’orme des Merisiers, 91190 Saint-Aubin (France); Maroni, R. [CEA, DAM, DIF, F-91297 Arpajon (France); Høghøj, P.; Hedacq, S. [Xenocs SA, 19, rue François Blumet, F-38360 Sassenage (France); Cibik, L.; Krumrey, M. [Physikalisch-Technische Bundesanstalt (PTB), Abbestr. 2-12, 10587 Berlin (Germany)

2014-12-11

The “Commissariat à l’énergie atomique et aux énergies alternatives” (CEA) studies and designs advanced X-ray diagnostics to probe dense plasmas produced at the future Laser MegaJoule (LMJ) facility. Mainly for X-ray imaging with high spatial resolution, different types of multilayer mirrors were developed to provide broadband X-ray reflectance at grazing incidence. These coatings are deposited on two toroidal mirror substrates that are then mounted into a Wolter-type geometry (working at a grazing angle of 0.45°) to realize an X-ray microscope. Non-periodic (depth graded) W/Si multilayer can be used in the broad photon energy range from 2 keV to 22 keV. A third flat mirror can be added for the spectral selection of the microscope. This mirror is coated with a Mo/Si multilayer for which the d-spacing varies in the longitudinal direction to satisfy the Bragg condition within the angular acceptance of the microscope and also to compensate the angular dispersion due to the field of the microscope. We present a study of such a so-called Göbel mirror which was optimized for photon energy of 10.35 keV. The three mirrors were coated using magnetron sputtering technology by Xenocs SA. The reflectance in the entire photon energy range was determined in the laboratory of the Physikalisch-Technische Bundesanstalt (PTB) at the synchrotron radiation facility BESSY II in Berlin.

Multilayer optics for monochromatic high-resolution X-ray imaging diagnostic in a broad photon energy range from 2 keV to 22 keV

Science.gov (United States)

Troussel, Ph.; Dennetiere, D.; Maroni, R.; Høghøj, P.; Hedacq, S.; Cibik, L.; Krumrey, M.

2014-12-01

The "Commissariat à l'énergie atomique et aux énergies alternatives" (CEA) studies and designs advanced X-ray diagnostics to probe dense plasmas produced at the future Laser MegaJoule (LMJ) facility. Mainly for X-ray imaging with high spatial resolution, different types of multilayer mirrors were developed to provide broadband X-ray reflectance at grazing incidence. These coatings are deposited on two toroidal mirror substrates that are then mounted into a Wolter-type geometry (working at a grazing angle of 0.45°) to realize an X-ray microscope. Non-periodic (depth graded) W/Si multilayer can be used in the broad photon energy range from 2 keV to 22 keV. A third flat mirror can be added for the spectral selection of the microscope. This mirror is coated with a Mo/Si multilayer for which the d-spacing varies in the longitudinal direction to satisfy the Bragg condition within the angular acceptance of the microscope and also to compensate the angular dispersion due to the field of the microscope. We present a study of such a so-called Göbel mirror which was optimized for photon energy of 10.35 keV. The three mirrors were coated using magnetron sputtering technology by Xenocs SA. The reflectance in the entire photon energy range was determined in the laboratory of the Physikalisch-Technische Bundesanstalt (PTB) at the synchrotron radiation facility BESSY II in Berlin.

Combined optic system based on polycapillary X-ray optics and single-bounce monocapillary optics for focusing X-rays from a conventional laboratory X-ray source

Energy Technology Data Exchange (ETDEWEB)

Sun, Xuepeng; Liu, Zhiguo [The Key Laboratory of Beam Technology and Materials Modification of the Ministry of Education, Beijing Normal University, Beijing 100875 (China); College of Nuclear Science and Technology, Beijing Normal University, Beijing 100875 (China); Beijing Radiation Center, Beijing 100875 (China); Sun, Tianxi, E-mail: stx@bnu.edu.cn [The Key Laboratory of Beam Technology and Materials Modification of the Ministry of Education, Beijing Normal University, Beijing 100875 (China); College of Nuclear Science and Technology, Beijing Normal University, Beijing 100875 (China); Beijing Radiation Center, Beijing 100875 (China); Yi, Longtao; Sun, Weiyuan; Li, Fangzuo; Jiang, Bowen [The Key Laboratory of Beam Technology and Materials Modification of the Ministry of Education, Beijing Normal University, Beijing 100875 (China); College of Nuclear Science and Technology, Beijing Normal University, Beijing 100875 (China); Beijing Radiation Center, Beijing 100875 (China); Ma, Yongzhong [Center for Disease Control and Prevention of Beijing, Beijing 100013 (China); Ding, Xunliang [The Key Laboratory of Beam Technology and Materials Modification of the Ministry of Education, Beijing Normal University, Beijing 100875 (China); College of Nuclear Science and Technology, Beijing Normal University, Beijing 100875 (China); Beijing Radiation Center, Beijing 100875 (China)

2015-12-01

Two combined optic systems based on polycapillary X-ray optics and single-bounce monocapillary optics (SBMO) were designed for focusing the X-rays from a conventional laboratory X-ray source. One was based on a polycapillary focusing X-ray lens (PFXRL) and a single-bounce ellipsoidal capillary (SBEC), in which the output focal spot with the size of tens of micrometers of the PFXRL was used as the “virtual” X-ray source for the SBEC. The other system was based on a polycapillary parallel X-ray lens (PPXRL) and a single-bounce parabolic capillary (SBPC), in which the PPXRL transformed the divergent X-ray beam from an X-ray source into a quasi-parallel X-ray beam with the divergence of sever milliradians as the incident illumination of the SBPC. The experiment results showed that the combined optic systems based on PFXRL and SBEC with a Mo rotating anode X-ray generator with the focal spot with a diameter of 300 μm could obtain a focal spot with the total gain of 14,300 and focal spot size of 37.4 μm, and the combined optic systems based on PPXRL and SBPC with the same X-ray source mentioned above could acquire a focal spot with the total gain of 580 and focal spot size of 58.3 μm, respectively. The two combined optic systems have potential applications in micro X-ray diffraction, micro X-ray fluorescence, micro X-ray absorption near edge structure, full field X-ray microscopes and so on.

The Nuclear Spectroscopic Telescope Array (NuSTAR) High-Energy X-ray Mission

Science.gov (United States)

Harrison, Fiona A.; Craig, Willliam W.; Christensen, Finn E.; Hailey, Charles J.; Zhang, William W.; Boggs, Steven E.; Stern, Daniel; Cook, W. Rick; Forster, Karl; Giommi, Paolo;

Transmission X-ray scattering as a probe for complex liquid-surface structures

Energy Technology Data Exchange (ETDEWEB)

Fukuto, Masafumi; Yang, Lin; Nykypanchuk, Dmytro; Kuzmenko, Ivan

2016-01-28

The need for functional materials calls for increasing complexity in self-assembly systems. As a result, the ability to probe both local structure and heterogeneities, such as phase-coexistence and domain morphologies, has become increasingly important to controlling self-assembly processes, including those at liquid surfaces. The traditional X-ray scattering methods for liquid surfaces, such as specular reflectivity and grazing-incidence diffraction, are not well suited to spatially resolving lateral heterogeneities due to large illuminated footprint. A possible alternative approach is to use scanning transmission X-ray scattering to simultaneously probe local intermolecular structures and heterogeneous domain morphologies on liquid surfaces. To test the feasibility of this approach, transmission small- and wide-angle X-ray scattering (TSAXS/TWAXS) studies of Langmuir films formed on water meniscus against a vertically immersed hydrophilic Si substrate were recently carried out. First-order diffraction rings were observed in TSAXS patterns from a monolayer of hexagonally packed gold nanoparticles and in TWAXS patterns from a monolayer of fluorinated fatty acids, both as a Langmuir monolayer on water meniscus and as a Langmuir–Blodgett monolayer on the substrate. The patterns taken at multiple spots have been analyzed to extract the shape of the meniscus surface and the ordered-monolayer coverage as a function of spot position. These results, together with continual improvement in the brightness and spot size of X-ray beams available at synchrotron facilities, support the possibility of using scanning-probe TSAXS/TWAXS to characterize heterogeneous structures at liquid surfaces.

X-ray grazing incidence studies of the 2D crystallization of monolayers of 1-alcohols at the air water interface

DEFF Research Database (Denmark)

Legrand, J.F.; Renault, A.; Konovalov, O.

1994-01-01

A new undulator producing an X-ray beam of high brilliance has been used at the European Synchrotron Radiation Facility (ESRF, Beamline-9, Troika) for investigating the structure of two-dimensional crystals of 1-tetradecanol, 1-dodecanol, 1-decanol and 1-nonanol. These fatty alcohols with relativ...

UV and X-ray Evolution of AR12230 as Observed with IRIS and FOXSI-II

Science.gov (United States)

Ryan, Daniel; Christe, Steven; Glesener, Lindsay; Vievering, Julie; Krucker, Sam; Ishikawa, Shin-Nosuke

2017-08-01

We present a multi-spectral and spatio-temporal analysis of AR12230 using both UV and X-ray spectroscopic imaging obtained as part of a coordinated observing campaign on 11 December 2014. The campaign involved IRIS (Interface Region Imaging Spectrometer) -- which provides both UV imaging and slit spectrograph observations of optically thick chromospheric and transition region emission -- and FOXSI-II (Focusing Optics X-ray Solar Imager) -- the second in a series of sounding rocket flights which combines grazing incidence direct focusing optics to produce solar X-ray spectroscopic imaging in the range 4-15keV. The active region exhibits a prolonged compact brightening in the IRIS 1330 A and 1400 A slit-jaw channels near the center of the active region throughout the duration of the observations. In the early phase of the observations FOXSI-II shows an X-ray source approximately 20x20 arcsec centered at the same location. The X-ray spectra show the presence of hot (~8 MK) thermal plasma and is suggestive of the presence of non-thermal electrons.. Later, two additional transient, spatially extended, simultaneous brightenings are observed, one of which was captured by the IRIS slit spectrograph. We combine these observations to explore the evolution and topology of the active region. Hydrodynamic modeling of the chromosphere is used to place a limit on the amount of non-thermal electrons required to produce the observed UV emission. This result is then compared to the limit inferred from the FOXSI-II X-ray spectra. Thus, we explore the role of non-thermal electrons and hydrodynamics in the energization and evolution of plasma in active regions.

Accuracy evaluation of a Compton X-ray spectrometer with bremsstrahlung X-rays generated by a 6 MeV electron bunch

Energy Technology Data Exchange (ETDEWEB)

Kojima, Sadaoki, E-mail: kojima-s@ile.osaka-u.ac.jp; Arikawa, Yasunobu; Zhang, Zhe; Ikenouchi, Takahito; Morace, Alessio; Nagai, Takahiro; Abe, Yuki; Sakata, Shouhei; Inoue, Hiroaki; Utsugi, Masaru; Nakai, Mitsuo; Nishimura, Hiroaki; Shiraga, Hiroyuki; Fujioka, Shinsuke; Azechi, Hiroshi [Institute of Laser Engineering, Osaka University, 2-6 Yamada-oka, Suita, Osaka 565-0871 (Japan); Nishimura, Yasuhiko; Togawa, Hiromi [Toyota Technical Development Corporation, 1-21 Imae, Hanamoto-cho, Toyota, Aichi 470-0334 (Japan); Ozaki, Tetsuo [National Institute for Fusion Science, 322-6 Oroshicho, Toki, Gifu 509-5292 (Japan); Kato, Ryukou [The Institute of Science and Industrial Research, Osaka University, 2-6 Yamada-oka, Suita, Osaka (Japan)

2014-11-15

A Compton-scattering-based X-ray spectrometer is developed to obtain the energy distribution of fast electrons produced by intense laser and matter interactions. Bremsstrahlung X-rays generated by fast electrons in a material are used to measure fast electrons’ energy distribution in matter. In the Compton X-ray spectrometer, X-rays are converted into recoil electrons by Compton scattering in a converter made from fused silica glass, and a magnet-based electron energy analyzer is used to measure the energy distribution of the electrons that recoil in the direction of the incident X-rays. The spectrum of the incident X-rays is reconstructed from the energy distribution of the recoil electrons. The accuracy of this spectrometer is evaluated using a quasi-monoenergetic 6 MeV electron bunch that emanates from a linear accelerator. An electron bunch is injected into a 1.5 mm thick tungsten plate to produce bremsstrahlung X-rays. The spectrum of these bremsstrahlung X-rays is obtained in the range from 1 to 9 MeV. The energy of the electrons in the bunch is estimated using a Monte Carlo simulation of particle-matter interactions. The result shows that the spectrometer's energy accuracy is ±0.5 MeV for 6.0 MeV electrons.

On the polarization mixing of X-rays

International Nuclear Information System (INIS)

Ohkawa, T.; Hashimoto, H.

1984-01-01

Relativistic quantum field theory is applied to discuss the process of interference of white X-rays and the mechanism of rotation of the polarization of X-rays in crystals. A two-photon state is studied theoretically for analyzing the mechanism of the polarization mixing. Diffracted X-ray photons are produced by two successive stages of interaction between incident X-rays and electrons in a crystal. A dispersion relation of diffracted X-rays similar to Laue's dynamic theory is shown by use of the S-matrix. A dynamical structure factor is defined on the base of Dirac's γ-matrix. (author)

Lifting the veil on the X-ray universe

Science.gov (United States)

1999-11-01

ESA's X-ray Multi Mirror mission - XMM - is the second Cornerstone in ESA's Long Term Scientific Programme (*). This new X-ray space telescope promises even more discoveries. With the large collecting area of its mirrors and the high sensitivity of its cameras, XMM is expected to increase radically our understanding of high-energy sources - clues to a mysterious past, and keys to understanding the future of the Universe. 174 wafer-thin X-ray mirrors X-rays coming from celestial objects are highly energetic and elusive. They can best be measured and studied after focusing a sufficient number upon sensitive detectors. To achieve this, XMM's Mirror Modules have been given a gargantuan appetite for X-rays. The space observatory combines three barrel-shaped telescope modules. In each are nested 58 wafer-thin concentric mirror shells highly polished and subtly shaped. Passing through at an extremely shallow angle, the so-called "grazing incidence", the X-rays will be beamed to the science instruments situated on the focal plane at the other extremity of the satellite. The three mirror modules have a total mirror surface of over 120m2 - practically the size of a tennis court.. The collecting power of XMM's three telescopes is the greatest ever seen on an X-ray space mission, many times more than the most recently launched X-ray satellite. The design and assembly of the mirror modules, their testing for operation in space and their precise calibration constitute one of the greatest achievements of the XMM programme. The flimsy mirror shells, with their gold reflective surface on a nickel backing, were made by replication like carbon copies from master moulds. They were shaped to an accuracy of a thousandth of a millimetre, and then polished to a smoothness a thousand times better than that. Packaged one within another like Russian dolls, each mirror was focused and centred with respect to its neighbour to an accuracy of 25 microns - a quarter of the width of a human hair

Intensity of diffracted X-rays from biomolecules with radiation damage caused by strong X-ray pulses

International Nuclear Information System (INIS)

Kai, Takeshi; Tokuhisa, Atsushi; Moribayashi, Kengo; Fukuda, Yuji; Kono, Hidetoshi; Go, Nobuhiro

2014-01-01

In order to realize the coherent X-ray diffractive imaging of single biomolecules, the diffraction intensities, per effective pixel of a single biomolecule with radiation damage, caused by irradiation using a strong coherent X-ray pulse, were examined. A parameter survey was carried out for various experimental conditions, using a developed simulation program that considers the effect of electric field ionization, which was slightly reported on in previous studies. The two simple relationships among the parameters were identified as follows: (1) the diffraction intensity of a biomolecule slightly increases with the incident X-ray energy; and that (2) the diffraction intensity is approximately proportional to the target radius, when the radius is longer than 400 Å, since the upper limit of the incident intensity for damage to the biomolecules marginally changes with respect to the target radius. (author)

Non-scanning x-ray fluorescence microscope: application to real time micro-imaging

International Nuclear Information System (INIS)

Sakurai, K.; Eba, H.

2000-01-01

So far, x-ray fluorescence (XRF) micro-imaging has been performed by a 2D positional scan of a sample against a collimated beam. Obtaining information on specific elements in a nondestructive manner is an attractive prospect for many scientific applications. Furthermore, a synchrotron micro-beam can enhance the spatial resolution down to 0.1 μm. However, the total measuring time becomes quite long (a few hours to a half day), since one needs a number of scanning points in order to obtain a high-quality image. It is possible to obtain an x-ray image with 1 M pixels and with 20 μm resolution in a very short time of 20 sec - 3 min using a non-scanning XRF microscope, which is based on completely different concept. In the present report, we discuss the application of this technique to real time micro-imaging. The experiments were carried out at BL-4A, Photon Factory, Tsukuba, Japan. We employed a grazing-incidence arrangement to make primary x-rays illuminate the whole sample surface. We adopted parallel-beam optics and extremely-close-geometry in order to detect x-ray fluorescence with a CCD camera. The selective-excitation capability of tunable monochromatic synchrotron radiation is a feasible method for distinguishing the elements of interest. One can obtain an image of each element by differentiating the images obtained above and below the absorption edges of interest. The growth of metallic dendrites from a solution dropped on a substrate was studied successfully. Several different growth patterns, corresponding to concentration and other conditions for diffusion, were observed as x-ray images. Since the present technique requires only 40 sec for each shot, it is possible to record a growing process through repeated exposures like a movie. The authors would like to thank Prof. A. Iida (Photon Factory) for his valuable comments. (author)

Reflectometer end station for synchrotron calibrations of Advanced X-ray Astrophysics Facility flight optics and for spectrometric research applications

International Nuclear Information System (INIS)

Graessle, D.E.; Fitch, J.J.; Ingram, R.; Zhang Juda, J.; Blake, R.L.

1995-01-01

Preparations have been underway to construct and test a facility for grazing incidence reflectance calibrations of flat mirrors at the National Synchrotron Light Source. The purpose is to conduct calibrations on witness flats to the coating process of the flight mirrors for NASA's Advanced X-ray Astrophysics Facility (AXAF). The x-ray energy range required is 50 eV--12 keV. Three monochromatic beamlines (X8C, X8A, U3A) will provide energy tunability over this entire range. The goal is to calibrate the AXAF flight mirrors with uncertainties approaching 1%. A portable end station with a precision-positioning reflectometer has been developed for this work. We have resolved the vacuum cleanliness requirements to preserve the coating integrity of the flats with the strict grazing-angle certainty requirements placed on the rotational control system of the reflectometer. A precision positioning table permits alignment of the system to the synchrotron beam to within 10 arcsec; the reflectometer's rotational control system can then produce grazing angle accuracy to within less than 2 arcsec, provided that the electron orbit is stable. At 10--12 keV, this degree of angular accuracy is necessary to achieve the calibration accuracy required for AXAF. However the most important energy regions for the synchrotron calibration are in the 2000--3200 eV range, where the M-edge absorption features of the coating element, iridium, appear, and the 300--700 eV range of the Ir N edges. The detail versus energy exhibited in these features cannot be traced adequately without a tunable energy source, which necessitates a synchrotron for this work. We present the mechanical designs, motion control systems, detection and measurement capabilities, and selected procedures for our measurements, as well as reflectance data

X-ray investigation of the interface structure of free standing InAs nanowires grown on GaAs[ anti 1 anti 1 anti 1]{sub B}

Energy Technology Data Exchange (ETDEWEB)

Bauer, Jens; Gottschalch, Volker; Wagner, Gerald [Universitaet Leipzig, Halbleiterchemie, Leipzig (Germany); Pietsch, Ullrich; Davydok, Anton; Biermanns, Andreas [Universitaet Siegen, Festkoerperphysik, Siegen (Germany); Grenzer, Joerg [Forschungszentrum Rossendorf, Institut fuer Ionenstrahlphysik und Materialforschung, Dresden (Germany)

2009-09-15

The heteroepitaxial growth process of InAs nanowires (NW) on GaAs[ anti 1 anti 1 anti 1]{sub B} substrate was investigated by X-ray grazing-incidence diffraction using synchrotron radiation. For crystal growth we applied the vapor-liquid-solid (VLS) growth mechanism via gold seeds. The general sample structure was extracted from various electron microscopic and X-ray diffraction experiments. We found a closed Ga{sub x}In{sub 1-x} As graduated alloy layer at the substrate to NW interface which was formed in the initial stage of VLS growth with a Au-Ga-In liquid alloy. With ongoing growth time a transition from this VLS layer growth to the conventional VLS NW growth was observed. The structural properties of both VLS grown crystal types were examined. Furthermore, we discuss the VLS layer growth process. (orig.)

The Development of a Differential Deposition Technique for Figure Correction in Grazing Incidence Optics

Data.gov (United States)

National Aeronautics and Space Administration — We propose the development of a physical-vapor-deposition coating technique to correct residual figure errors in grazing-incidence optics. The process involves...

X-ray diffraction imaging of material microstructures

KAUST Repository

Varga, Laszlo

2016-10-20

Various examples are provided for x-ray imaging of the microstructure of materials. In one example, a system for non-destructive material testing includes an x-ray source configured to generate a beam spot on a test item; a grid detector configured to receive x- rays diffracted from the test object; and a computing device configured to determine a microstructure image based at least in part upon a diffraction pattern of the x-rays diffracted from the test object. In another example, a method for determining a microstructure of a material includes illuminating a beam spot on the material with a beam of incident x-rays; detecting, with a grid detector, x-rays diffracted from the material; and determining, by a computing device, a microstructure image based at least in part upon a diffraction pattern of the x-rays diffracted from the material.

Performance evaluation of X-ray CT using visible scintillation light

International Nuclear Information System (INIS)

Kodama, Kiyoyuki; Hamada, Minoru; Suzuki, Tamotsu; Hashimoto, Masatoshi; Hanada, Takashi; Ide, Tatsuya; Maruyama, Koichi

2004-01-01

We proposed a new method of performance evaluation for X-ray CT using visible scintillation light and examined its usefulness in this study. When we scanned a plastic scintillator disk in a gantry opening of the X-ray CT, we could observe visible scintillation light. The rotation of the light-emitting area of the disk corresponded to that of the X-ray tube. We were able to record the scintillation light by digital video camera. By analyzing the area of visible scintillation light, the rotation speed of the X-ray tube, angular spread of the X-ray beam, uniformity of the incident X-rays, and change in X-ray energy were measured. No other method is available to obtain the above parameters of X-ray CT during a single CT scan. In the measurements of the uniformity of incident X-rays and change of X-ray energy, our method showed good accuracy in detecting the attenuation caused by the couch between the X-ray tube and the plastic scintillator disc. The proposed method is inexpensive and easy-to-use. We conclude that the method is a useful tool for performance evaluation as well as a maintenance tool for X-ray CT. (author)

Dependence on incident angle of solid state detector response to gamma-rays

International Nuclear Information System (INIS)

Yamanishi, Hirokuni; Yamaguchi, Satarou; Yamaguchi, Takayuki; Ueki, Kohtaro

2002-01-01

The shape and size of a NaI(Tl) scintillator that should maximize response variation with γ-ray incident angle was estimated by analytical model calculation. It proved that, even for gamma rays of energy exceeding 1 MeV, a slab detector measuring 50 cm x 50 cm x 5 cm thick should present a ratio of at least 4 between maximum and minimum responses against incidence at different angles. For a sample case of 60 keV gamma rays, estimation of the incident angle dependence by means of Monte Carlo simulation agreed well with experiment using a CZT detector. The counts from photo-electric peak varied with incident angle roughly along a sine curve. The foregoing finding served as basis for proposing a practical direction finder for γ-ray source operating on the principle of determining the source direction from variations in count with incident angle. (author)

Diffuse x-ray scattering and transmission electron microscopy study of defects in antimony-implanted silicon

Science.gov (United States)

Takamura, Y.; Marshall, A. F.; Mehta, A.; Arthur, J.; Griffin, P. B.; Plummer, J. D.; Patel, J. R.

2004-04-01

Ion implantation followed by laser annealing has been used to create supersaturated and electrically active concentrations of antimony in silicon. Upon subsequent thermal annealing, however, these metastable dopants deactivate towards the equilibrium solubility limit. In this work, the formation of inactive antimony structures has been studied with grazing incidence diffuse x-ray scattering, and transmission electron microscopy, and the results are correlated to previous high-resolution x-ray diffraction data. We find that at a concentration of 6.0×1020 cm-3, small, incoherent clusters of radius 3-4 Å form during annealing at 900 °C. At a higher concentration of 2.2×1021 cm-3, deactivation at 600 °C occurs through the formation of small, antimony aggregates and antimony precipitates. The size of these precipitates from diffuse x-ray scattering is roughly 15 Å in radius for anneal times from 15 to 180 seconds. This value is consistent with the features observed in high-resolution and mass contrast transmission electron microscopy images. The coherent nature of the aggregates and precipitates causes the expansion of the surrounding silicon matrix as the deactivation progresses. In addition, the sensitivity of the diffuse x-ray scattering technique has allowed us to detect the presence of small clusters of radius ˜2 Å in unprocessed Czochralski silicon wafers. These defects are not observed in floating zone silicon wafers, and are tentatively attributed to thermal donors.

The fabrication and characterization of replicated and lacquer coated grazing

International Nuclear Information System (INIS)

Ulmer, M.P.; Haidle, R.; Altkorn, R.; Georgeopolos, P.; Rodricks, B.; Takacs, P.Z.

1992-01-01

This paper reports on work done over the past two years in our laboratory to produce X-ray optics. We also report on tests that we have made to evaluate the performance of pieces that we have produced. As we progress towards the 21st century, there is a growing need to understand fabrication techniques for grazing incidence optics. To this end we report our results of fabricating, testing, and measuring both Wolter I optics and flats. We have used the techniques of lacquer coating. We have made flats to determine our ability to coat surfaces with lacquer and gold, as well as to demonstrate reflectivity up to 40 keV. We also produced Wolter I optics nickel optics with a gold coated optical surface. Here we report and interpret results from X-ray reflectivity and Wyko profiler optical measurements. We also describe our fabrication process and provide a critique of the process and describe how we hope to further improve upon the basic technique

Synchrotron x-ray methods in studies of thin organic film structure

International Nuclear Information System (INIS)

Gentle, I.

2002-01-01

Full text: In recent years, the study of the structures of organic films as thin as a single monolayer has been revolutionized by methods that take advantage of the characteristics of synchrotron radiation. In particular, the methods of grazing incidence X-ray diffraction (GIXD) and X-ray reflectivity have led to a number of valuable insights into structural aspects of thin films at molecular resolution. Our group has been studying films formed at the air/water interface as insoluble monolayers and subsequently transferred to solid substrates using either the vertical (Langmuir-Blodgett) or horizontal (Langmuir-Schaeffer) methods. The main aim of these experiments is to exert control over film structure in the direction parallel to the substrate surface. This is highly desirable in order to design devices that exploit the optical and electrooptical properties of functional materials, but is difficult to do. By varying the chemical structure of the film materials and controlling deposition conditions a degree of control is possible, but only using synchrotron methods can it be easily verified. We have also developed a novel method of rapidly collecting data from GIXD measurements by the application of area detection (imaging plates), which has made possible measurements of dynamic processes such as in-situ annealing. Such measurements are not possible using traditional scanning methods. One area of current interest is films composed of porphyrins as functional materials, either alone or as mixed films with fatty acids. We have been investigating ways of assembling porphyrins in such a way as to overcome the tendency to aggregate, and to produce patterning and ordered structures in the plane of the interface. Examples will be given of how film composition and deposition method affects the final structure, and of how X-ray methods can be used to elucidate both the structures and the mechanisms. Copyright (2002) Australian X-ray Analytical Association Inc

Quasimonochromatic x-ray computed tomography by the balanced filter method using a conventional x-ray source

International Nuclear Information System (INIS)

Saito, Masatoshi

2004-01-01

A quasimonochromatic x-ray computed tomography (CT) system utilizing balanced filters has recently been developed for acquiring quantitative CT images. This system consisted of basic components such as a conventional x-ray generator for radiography, a stage for mounting and rotating objects, and an x-ray line sensor camera. Metallic sheets of Er and Yb were used as the balanced filters for obtaining quasimonochromatic incident x rays that include the characteristic lines of the W Kα doublet from a tungsten target. The mean energy and energy width of the quasimonochromatic x rays were determined to be 59.0 and 1.9 keV, respectively, from x-ray spectroscopic measurements using a high-purity Ge detector. The usefulness of the present x-ray CT system was demonstrated by obtaining spatial distributions of the linear attenuation coefficients of three selected samples--a 20 cm diameter cylindrical water phantom, a 3.5 cm diameter aluminum rod, and a human head phantom. The results clearly indicate that this apparatus is surprisingly effective for estimating the distribution of the linear attenuation coefficients without any correction of the beam-hardening effect. Thus, implementing the balanced filter method on an x-ray CT scanner has promise in producing highly quantitative CT images

X-ray therapy with enhanced effectiveness

International Nuclear Information System (INIS)

Silberbauer, F.

1989-01-01

The introduction of iodine atoms into a malignant tumor by intravenous injection of a contrast medium that is excreted by way of the kidneys selectively increases the tumor's capacity for the absorption of X-ray photons. This effect is exploited in CCT, but in high-voltage X-ray therapy it leads to an elevated focal dose while the incident dose remains the same. (orig.) [de

Optimizing x-ray mirror thermal performance using variable length cooling for second generation FELs

Science.gov (United States)

Hardin, Corey L.; Srinivasan, Venkat N.; Amores, Lope; Kelez, Nicholas M.; Morton, Daniel S.; Stefan, Peter M.; Nicolas, Josep; Zhang, Lin; Cocco, Daniele

2016-09-01

The success of the LCLS led to an interest across a number of disciplines in the scientific community including physics, chemistry, biology, and material science. Fueled by this success, SLAC National Accelerator Laboratory is developing a new high repetition rate free electron laser, LCLS-II, a superconducting linear accelerator capable of a repetition rate up to 1 MHz. Undulators will be optimized for 200 to 1300 eV soft X-rays, and for 1000 to 5000 eV hard X-rays. To absorb spontaneous radiation, higher harmonic energies and deflect the x-ray beam to various end stations, the transport and diagnostics system includes grazing incidence plane mirrors on both the soft and Hard X-ray beamline. To deliver the FEL beam with minimal power loss and wavefront distortion, we need mirrors of height errors below 1nm rms in operational conditions. We need to mitigate the thermal load effects due to the high repetition rate. The absorbed thermal profile is highly dependent on the beam divergence, and this is a function of the photon energy. To address this complexity, we developed a mirror cradle with variable length cooling and first order curve correction. Mirror figure error is minimized using variable length water-cooling through a gallium-indium eutectic bath. Curve correction is achieved with an off-axis bender that will be described in details. We present the design features, mechanical analysis and results from optical and mechanical tests of a prototype assembly, with particular regards to the figure sensitivity to bender corrections.

Differential dose albedo for high-energy X-rays on concrete slab

International Nuclear Information System (INIS)

Kato, Hideki

2006-01-01

We computed the differential dose albedo (α D ) for high-energy X-rays on a concrete slab when the incident angle, reflection angle, and azimuth angle were changed, by means of Monte Carlo simulation. We found that α D changed with incident, reflection, and azimuth angles to the concrete slab. On the whole, the larger the incident angle, the larger α D tended to become. If the incident angle and reflection angle were the same, the larger the azimuth angle, the smaller α D tended to become. When the incident, reflection, and azimuth angles were the same, the smaller the X-ray energy was, the larger α D became, in the order of 10 MV, 6 MV, and 4 MV X-rays. (author)

Laboratory characterization of Woelter x-ray optics

International Nuclear Information System (INIS)

Remington, B.A.; Morales, R.I.

1994-04-01

We have conducted an extensive series of characterization measurements of a Woe1ter incidence x-ray microscope. The measurements were carried out on 5% sectors of the Woe1ter x-ray optic in a laboratory utilizing a high brightness, ''point'' x-ray source and fall into two categories. (1) Absolute reflectance measurements as a function of x-ray energy were made with Si(Li) detectors to acquire continuum spectra prior to and after reflecting off the Woe1ter optic. (2) Spatial resolution measurements were made using back-illuminated pinholes or grids imaged onto film or an x-ray CCD camera. The depth of field was mapped out by varying the distance between the Woe1ter optic and the backlit grid

High resolution x-ray scattering studies of strain in epitaxial thin films of yttrium silicide grown on silicon (111)

International Nuclear Information System (INIS)

Marthinez-Miranda, L.J.; Santiago-Aviles, J.J.; Siegal, M.P.; Graham, W.R.; Heiney, P.A.

1990-01-01

The authors have used high resolution grazing incidence x-ray scattering (GIXS) to study the in- plane and out-of-plane structure of epitaxial YSi 2-x films grown on Si(111), with thicknesses ranging from 85 Angstrom to 510 Angstrom. Their results indicate that the films are strained, and that film strain increases as a function of thickness, with lattice parameters varying from a = 3.846 Angstrom/c = 4.142 Angstrom for the 85 Angstrom film to a = 3.877 Angstrom/c = 4.121 Angstrom for the 510 Angstrom film. The authors correlate these results with an increase in pinhole areal coverage as a function of thickness. In addition, the authors' measurements show no evidence for the existence of ordered silicon vacancies in the films

U-shape rotating anti-cathode compact X-ray generator: 20 times stronger than the commercially available X-ray source

Energy Technology Data Exchange (ETDEWEB)

Sakabe, N., E-mail: sakabe-dsb@sbsp.jp; Sakabe, K. [High Energy Accelerator Research Organization (KEK), 1-1 Oho, Tsukuba 305-0801 (Japan); Foundation for Advancement of International Science (FAIS), Kasuga 3-chome, Tsukuba, Ibaraki 305-0821 (Japan); Ohsawa, S.; Sakai, T.; Kobayakawa, H.; Sugimura, T.; Ikeda, M.; Tawada, M. [High Energy Accelerator Research Organization (KEK), 1-1 Oho, Tsukuba, Ibaraki 305-0801 (Japan); Watanabe, N.; Sasaki, K. [Nagoya University, Chikusa, Nagoya, Aichi 464-8603 (Japan); Wakatsuki, M. [National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8568 (Japan)

2013-11-01

A new type of U-shape anti-cathode X-ray generator in which the inner surface of a cylindrical target is irradiated by an electron beam has been made by modifying a conventional rotating anti-cathode X-ray generator whose brightness in the catalog is 12 kW mm{sup −2}. A brightness of 129 kW mm{sup −2} was thereby obtained with this new U-shape-type X-ray generator. This new X-ray generator is expected to be of keen interest for applications in academia, industry and in hospitals. A new type of U-shape anti-cathode X-ray generator in which the inner surface of a cylindrical target is irradiated by an electron beam has been made by modifying a conventional rotating anti-cathode X-ray generator whose brightness in the catalog is 12 kW mm{sup −2}. The target material (Cu), target radius (50 mm) and rotating speed (6000 r.p.m.) were not changed in this modification. A brightness of 52 kW mm{sup −2} was obtained by this U-shape-type X-ray generator. This means that the brightness of the new type is 4.3 times greater than that of the old unmodified one. Furthermore, the new-type X-ray generator yielded a brightness of 129 kW mm{sup −2} by adding a carbon coating on the Cu target. This means an overall increase of brightness of ten times. The original generator has the highest brightness in the generators of the same class (having a radius of 50 mm and rotation speed of 6000 r.p.m.). Observations showed that Cu Kα counts at vertical incidence of the electron beam onto the surface of the new target, which is initially optically smooth, decrease as the surface is roughened by a severe thermal stress caused by strong electron beam exposure. Further observation reveals, however, that oblique incidence of the electron beam onto the roughened surface drastically increased the X-ray output and amounts to twice as much as that from a smooth surface at vertical incidence. Thus, at the present stage, an overall increase of brightness has been realised at a level 20 times

High-speed image converter x-ray studies

International Nuclear Information System (INIS)

Bryukhnevitch, G.I.; Kas'yanov, Yu.S.; Korobkin, V.V.; Prokhorov, A.M.; Stepanov, B.M.; Chevokin, V.K.; Schelev, M.Ya.

1975-01-01

Two X-ray high-speed image-converter cameras (ICC) have been developed. In the first one a soft X-ray radiation is converted into visible light with the aid of a 0.5ns response time, plastic scintillator. The second camera incorporates a photocathode which is sensitive to visible and X-ray radiation. Its calculated temporal resolution approaches 5 to 7ps. Both developed cameras were employed for studies of X-ray radiation emitted by laser plasma. For the smooth nanosecond excited laser pulses, a noticeable amplitude modulation was recorded in all laser pulses reflected by plasma as well as in each third pulse of X-ray plasma radiation. It was also observed that the duration of X-ray plasma radiation is 20 to 40% shorter than that of the incident nanosecond laser pulses and this duration being 3 to 6 times longer than that of the picosecond irradiating pulses. The half-width of the recorded X-ray plasma pulses was 30 to 60ps. (author)

X-rays and photocarcinogenesis in hairless mice

DEFF Research Database (Denmark)

Lerche, Catharina M; Philipsen, Peter A; Wulf, Hans Christian

2013-01-01

It is well known that excessive X-ray radiation can cause non-melanoma skin cancers. With the increased incidence of sun-related skin cancer there is a need to investigate the combination of sunlight and X-rays. Immunocompetent C3.Cg/TifBomTac mice (n = 298) were divided into 12 groups. Mice were...

Lifetime estimation of a time projection chamber x-ray polarimeter

Science.gov (United States)

Hill, Joanne E.; Black, J. Kevin; Brieda, Lubos; Dickens, Patsy L.; Montt de Garcia, Kristina; Hawk, Douglas L.; Hayato, Asami; Jahoda, Keith; Mohammed, Jelila

2013-09-01

The Gravity and Extreme Magnetism Small Explorer (GEMS) X-ray polarimeter Instrument (XPI) was designed to measure the polarization of 23 sources over the course of its 9 month mission. The XPI design consists of two telescopes each with a polarimeter assembly at the focus of a grazing incidence mirror. To make sensitive polarization measurements the GEMS Polarimeter Assembly (PA) employed a gas detection system based on a Time Projection Chamber (TPC) technique. Gas detectors are inherently at risk of degraded performance arising from contamination from outgassing of internal detector components or due to loss of gas. This paper describes the design and the materials used to build a prototype of the flight polarimeter with the required GEMS lifetime. We report the results from outgassing measurements of the polarimeter subassemblies and assemblies, enclosure seal tests, life tests, and performance tests that demonstrate that the GEMS lifetime is achievable. Finally we report performance measurements and the lifetime enhancement from the use of a getter.

Hierarchical nanoparticle morphology for platinum supported on SrTiO3 (0 0 1): A combined microscopy and X-ray scattering study

International Nuclear Information System (INIS)

Christensen, Steven T.; Lee, Byeongdu; Feng Zhenxing; Hersam, Mark C.; Bedzyk, Michael J.

2009-01-01

The morphology of metal nanoparticles supported on oxide substrates plays an important role in heterogeneous catalysis and in the nucleation of thin films. For platinum evaporated onto SrTiO 3 (0 0 1) and vacuum annealed we find an unexpected growth formation of Pt nanoparticles that aggregate into clusters without coalescence. This hierarchical nanoparticle morphology with an enhanced surface-to-volume ratio for Pt is analyzed by grazing incidence small-angle X-ray scattering (GISAXS), X-ray fluorescence (XRF), atomic force microscopy (AFM) and high-resolution scanning electron microscopy (SEM). The nanoparticle constituents of the clusters measure 2-4 nm in size and are nearly contiguously spaced where the average edge-to-edge spacing is less than 1 nm. These particles make up the clusters, which are 10-50 nm in diameter and are spaced on the order of 100 nm apart.

A compact scanning soft X-ray microscope

International Nuclear Information System (INIS)

Trail, J.A.

1989-01-01

Soft x-ray microscopes operating at wavelengths between 2.3 nm and 4.4 nm are capable of imaging wet biological cells with a resolution many times that of a visible light microscope. Several such soft x-ray microscopes have been constructed. However, with the exception of contact microscopes, all use synchrotrons as the source of soft x-ray radiation and Fresnel zone plates as the focusing optics. These synchrotron based microscopes are very successful but have the disadvantage of limited access. This dissertation reviews the construction and performance of a compact scanning soft x-ray microscope whose size and accessibility is comparable to that of an electron microscope. The microscope uses a high-brightness laser-produced plasma as the soft x-ray source and normal incidence multilayer-coated mirrors in a Schwarzschild configuration as the focusing optics. The microscope operates at a wavelength of 14 nm, has a spatial resolution of 0.5 μm, and has a soft x-ray photon flux through the focus of 10 4 -10 5 s -1 when operated with only 170 mW of average laser power. The complete system, including the laser, fits on a single 4' x 8' optical table. The significant components of the compact microscope are the laser-produced plasma (LPP) source, the multilayer coatings, and the Schwarzschild objective. These components are reviewed, both with regard to their particular use in the current microscope and with regard to extending the microscope performance to higher resolution, higher speed, and operation at shorter wavelengths. Measurements of soft x-ray emission and debris emission from our present LPP source are presented and considerations given for an optimal LPP source. The LPP source was also used as a broadband soft x-ray source for measurement of normal incidence multilayer mirror reflectance in the 10-25 nm spectral region

Spatially resolved single crystal x-ray spectropolarimetry of wire array z-pinch plasmas.

Science.gov (United States)

Wallace, M S; Haque, S; Neill, P; Pereira, N R; Presura, R

2018-01-01

A recently developed single-crystal x-ray spectropolarimeter has been used to record paired sets of polarization-dependent and axially resolved x-ray spectra emitted by wire array z-pinches. In this measurement, two internal planes inside a suitable crystal diffract the x-rays into two perpendicular directions that are normal to each other, thereby separating incident x-rays into their linearly polarized components. This paper gives considerations for fielding the instrument on extended sources. Results from extended sources are difficult to interpret because generally the incident x-rays are not separated properly by the crystal. This difficulty is mitigated by using a series of collimating slits to select incident x-rays that propagate in a plane of symmetry between the polarization-splitting planes. The resulting instrument and some of the spatially resolved polarized x-ray spectra recorded for a 1-MA aluminum wire array z-pinch at the Nevada Terawatt Facility at the University of Nevada, Reno will be presented.

Fluorescent x-ray computed tomography to visualize specific material distribution

Science.gov (United States)

Takeda, Tohoru; Yuasa, Tetsuya; Hoshino, Atsunori; Akiba, Masahiro; Uchida, Akira; Kazama, Masahiro; Hyodo, Kazuyuki; Dilmanian, F. Avraham; Akatsuka, Takao; Itai, Yuji

1997-10-01

Fluorescent x-ray computed tomography (FXCT) is being developed to detect non-radioactive contrast materials in living specimens. The FXCT systems consists of a silicon channel cut monochromator, an x-ray slit and a collimator for detection, a scanning table for the target organ and an x-ray detector for fluorescent x-ray and transmission x-ray. To reduce Compton scattering overlapped on the K(alpha) line, incident monochromatic x-ray was set at 37 keV. At 37 keV Monte Carlo simulation showed almost complete separation between Compton scattering and the K(alpha) line. Actual experiments revealed small contamination of Compton scattering on the K(alpha) line. A clear FXCT image of a phantom was obtained. Using this system the minimal detectable dose of iodine was 30 ng in a volume of 1 mm3, and a linear relationship was demonstrated between photon counts of fluorescent x-rays and the concentration of iodine contrast material. The use of high incident x-ray energy allows an increase in the signal to noise ratio by reducing the Compton scattering on the K(alpha) line.

Side-pumped Nd:YVO4 cw laser with grazing-incidence small angle configuration

International Nuclear Information System (INIS)

Camargo, Fabiola de Almeida

2006-01-01

Within the existing variety of laser cavity geometries and gain materials there is one combination that is particularly interesting because of its reduced complexity and high efficiency: the edge-pumped slab-laser using grazing-incidence geometry and a gain media with a very high pump absorption cross-section. In this work we studied a diode side-pumped Nd:YVO 4 cw laser. We describe a single and a multiple bounce laser configurations. We demonstrate 22 W of multimode output power for 35 watts of pump power with a single pass through the gain media. A high optical-to-optical conversion efficiency of 63% and a slope efficiency of 74% with a very compact and simple Nd:YVO 4 cavity that uses joint stability zones was achieved. The beam quality was M 2 = 26 x 11 in the horizontal and vertical direction, respectively. With a double pass configuration we achieved 17 watts with a better beam quality of M 2 = 3,4 x 3,7, in the horizontal and vertical direction, respectively. (author)

Adjustment of a low energy, X-rays generator (6 kV - 50 mA). Application to X-rays detectors calibration

International Nuclear Information System (INIS)

Legistre, C.

1995-02-01

The aim of this memoir is the calibration of an aluminium photocathode X-rays photoelectric detector, in the spectral range 0,5 keV - 1,5 KeV, with a continuous X-ray source. The detectors's calibration consist to measure the detector's sensitivity versus incident energy. In order to produce monochromatic incident beam on the detector, we used a multilayer mirror whose reflectivity was characterized. The measurements are compared to those realized in an other laboratory. (authors). 36 refs., 61 figs., 13 tabs., 2 photos

X-ray holography. Atoms in three dimensions

International Nuclear Information System (INIS)

Tegze, M.

2005-01-01

The principles of atomic resolution X-ray holography was elaborated in 1991. X-ray photons scatter thousand times less on atoms than electrons of the same wavelength. As a result, both free path and penetration depth are higher which giver information about the bulk material. X-ray holography is realized by irradiating the single crystal sample with radiation from external X-ray source. The incident radiation is ionizing the atoms of the sample to emit fluorescent radiation. The angle dependence of the fluorescent radiation results an image containing the hologram. The hologram itself is extremely small compared to the background that needs 10 10 capturing photons to recover image. Using Thomas Gog's method and synchrotron radiation the X-ray holography becomes more usable, but the method still needs refining both experimentally and theoretically. (TRA)

Auger and depth profile analysis of synthetic crystals for dispersion of soft x-rays

International Nuclear Information System (INIS)

Rachocki, K.D.; Brown, D.R.; Springer, R.W.; Arendt, P.N.

1983-01-01

Numerous samples have been fabricated and analyzed as part of a program to produce soft x-ray dispersion elements for various laboratory applications. The majority of this work has centered around the carbon/tungsten system, although several other low-Z/high-Z pairs have been investigated. This report describes the development of certain vacuum-deposition techniques for fabricating these dispersion elements, based upon results obtained from x-ray reflectivity measurements and Auger depth-profile analysis. The composition of the films is chiefly alternating layers of tungsten carbide and carbon. Excess carbon is introduced during the deposition of the tungsten to ensure that the carbide layer is fully stoichiometric. Layer thickness ranged from approx. 5 to 30 A for the carbide and from approx. 15 to 80 A for the carbon. The reflectivity measurements were made using Fe and Al K/sub α/ at grazing incidence. The emphasis in these studies is on the application of surface-analysis results in suggesting modifications to the fabrication process and in evaluating the results such modifications have on the layer stoichiometry, continuity, and periodicity of the dispersion elements so produced

X-Ray and Gamma-Ray Radiation Detector

DEFF Research Database (Denmark)

2015-01-01

Disclosed is a semiconductor radiation detector for detecting X-ray and / or gamma-ray radiation. The detector comprises a converter element for converting incident X-ray and gamma-ray photons into electron-hole pairs, at least one cathode, a plurality of detector electrodes arranged with a pitch...... (P) along a first axis, a plurality of drift electrodes, a readout circuitry being configured to read out signals from the plurality of detector electrodes and a processing unit connected to the readout circuitry and being configured to detect an event in the converter element. The readout circuitry...... is further configured to read out signals from the plurality of drift electrodes, and the processing unit is further configured to estimate a location of the event along the first axis by processing signals obtained from both the detector electrodes and the drift electrodes, the location of the event along...

A new generation of x-ray spectrometry UHV instruments at the SR facilities BESSY II, ELETTRA and SOLEIL

Energy Technology Data Exchange (ETDEWEB)

Lubeck, J., E-mail: janin.lubeck@ptb.de; Fliegauf, R.; Holfelder, I.; Hönicke, P.; Müller, M.; Pollakowski, B.; Ulm, G.; Weser, J.; Beckhoff, B. [Physikalisch-Technische Bundesanstalt (PTB), Abbestr. 2-12, 10587 Berlin (Germany); Bogovac, M.; Kaiser, R. B.; Karydas, A. G.; Leani, J. J.; Migliori, A.; Sghaier, H. [Nuclear Science and Instrumentation Laboratory, IAEA Laboratories, A-2444, Seibersdorf (Austria); Boyer, B.; Lépy, M. C.; Ménesguen, Y. [CEA, LIST, Laboratoire National Henri Becquerel, Bât. 602 PC 111, CEA-Saclay 91191 Gif-sur-Yvette c. (France); Detlefs, B. [CEA-LETI, Minatec Campus, 17 rue des Martyrs, 38054 Grenoble (France); Eichert, D. [Elettra - Sincrotrone Trieste (EST) S.C.p.A., 34149 Basovizza, Trieste (Italy); and others

2016-07-27

A novel type of ultra-high vacuum instrument for X-ray reflectometry and spectrometry-related techniques for nanoanalytics by means of synchrotron radiation (SR) has been constructed and commissioned at BESSY II. This versa-tile instrument was developed by the PTB, Germany’s national metrology institute, and includes a 9-axis manipulator that allows for an independent alignment of the samples with respect to all degrees of freedom. In addition, it integrates a rotational and translational movement of several photodiodes as well as a translational movement of a beam-geometry-defining aperture system. Thus, the new instrument enables various analytical techniques based on energy dispersive X-ray detectors such as reference-free X-Ray Fluorescence (XRF) analysis, total-reflection XRF, grazing-incidence XRF, in addition to optional X-Ray Reflectometry (XRR) measurements or polarization-dependent X-ray absorption fine structure analyses (XAFS). Samples having a size of up to (100 × 100) mm{sup 2}; can be analyzed with respect to their mass deposition, elemental, spatial or species composition. Surface contamination, nanolayer composition and thickness, depth pro-file of matrix elements or implants, nanoparticles or buried interfaces as well as molecular orientation of bonds can be accessed. Three technology transfer projects of adapted instruments have enhanced X-Ray Spectrometry (XRS) research activities within Europe at the synchrotron radiation facilities ELETTRA (IAEA) and SOLEIL (CEA/LNE-LNHB) as well as at the X-ray innovation laboratory BLiX (TU Berlin) where different laboratory sources are used. Here, smaller chamber requirements led PTB in cooperation with TU Berlin to develop a modified instrument equipped with a 7-axis manipulator: reduced freedom in the choice of experimental geometry modifications (absence of out-of-SR-plane and reference-free XRS options) has been compensated by encoder-enhanced angular accuracy for GIXRF and XRR.

Soft x-ray lasing in a capillary discharge

International Nuclear Information System (INIS)

Lee, Tong-Nyong; Shin, Hyun-Joon; Kim, Dong-Eon

1995-01-01

Soft x-ray lasing in the C VI Balmer α transition is observed in a capillary discharge. The capillary is made of polyethylene with a bore diameter of 1.2 mm. Plasma radiation from the discharge is analyzed using a toroidal mirror and a two-meter grazing-incidence spectrograph-monochromator. The electron temperatures are measured at both the axial and the peripheral region close to the capillary wall, using space-resolved spectra. A comparison of the branching ratio in the hot (axial) and the cool (peripheral) plasma regions indicates that there is a large population inversion between n=3 and 2 states of C 5+ ions in the cool (Te∼13 eV) region of the capillary plasma. Relative line intensities of the C VI Hα and a number of non-lasing lines are compared in this cool region as a function of capillary length. The C VI Hα line intensity increases exponentially whereas those of non-lasing transitions increase linearly with an increase of the capillary length. The gain coefficient thus measured indicates 2.8 cm -1 . The lasing line intensity does not seem to increase exponentially beyond a capillary length of 16 mm and the gain-length product, gL, obtained here is 3.9, which is a typical value one would expect for a recombination soft x-ray laser. The photoelectric signals of the lasing line indicate that the lasing takes place about 40 ns after the current peak in the first half cycle of the capillary discharge, with a lasing pulse width of 60 ns in FWHM

Time-resolved X-ray PIV technique for diagnosing opaque biofluid flow with insufficient X-ray fluxes.

Science.gov (United States)

Jung, Sung Yong; Park, Han Wook; Kim, Bo Heum; Lee, Sang Joon

2013-05-01

X-ray imaging is used to visualize the biofluid flow phenomena in a nondestructive manner. A technique currently used for quantitative visualization is X-ray particle image velocimetry (PIV). Although this technique provides a high spatial resolution (less than 10 µm), significant hemodynamic parameters are difficult to obtain under actual physiological conditions because of the limited temporal resolution of the technique, which in turn is due to the relatively long exposure time (~10 ms) involved in X-ray imaging. This study combines an image intensifier with a high-speed camera to reduce exposure time, thereby improving temporal resolution. The image intensifier amplifies light flux by emitting secondary electrons in the micro-channel plate. The increased incident light flux greatly reduces the exposure time (below 200 µs). The proposed X-ray PIV system was applied to high-speed blood flows in a tube, and the velocity field information was successfully obtained. The time-resolved X-ray PIV system can be employed to investigate blood flows at beamlines with insufficient X-ray fluxes under specific physiological conditions. This method facilitates understanding of the basic hemodynamic characteristics and pathological mechanism of cardiovascular diseases.

Soft X-rays from the sunlit earth's atmosphere

International Nuclear Information System (INIS)

McKenzie, D.L.; Rugge, H.R.; Charles, P.A.

1982-01-01

The HEAO-1 A-2 experiment low energy proportional counters have been used to measure the X-ray spectrum of the sunlit earth in the energy range 0.2 to 0.8 keV. The X-rays arise by coherent scattering of, or fluorescence of atmospheric constituents by, solar coronal X-rays incident on the atmosphere. Although the relative spectral contributions of the two processes depend upon the sun-earth-satellite geometry, fluorescent oxygen and nitrogen K X-ray emission is always important. The observed spectra were compared with calculations in order to derive the coronal temperature and emission measure, parameters that characterize the incident solar spectrum. These derived parameters agree well with the expected values for the nonflaring sun, and good agreement was obtained between measurements closely spaced in time but having a wide range of geometries and counting rates. Thus X-ray observations of the sunlit earth's atmosphere can be a useful monitor of solar activity for satellite-borne instrumentation unable to view the sun directly. The total measured fluorescent line flux agreed well with calculations, but the N:O line ratio did not. This disagreement is attributed to several causes which are discussed. (author)

Uniformity of the soft-x-ray emissions from gold foils irradiated by OMEGA laser beams determined by a two-mirror normal-incidence microscope with multilayer coatings

International Nuclear Information System (INIS)

Seely, John F.; Boehly, Thomas; Pien, Gregory; Bradley, David

1998-01-01

A two-mirror normal-incidence microscope with multilayer coatings was used to image the soft-x-ray emissions from planar foils irradiated by OMEGA laser beams. The bandpass of the multilayer coatings was centered at a wavelength of 48.3 Angstrom (257-eV energy) and was 0.5 Angstrom wide. Five overlapping OMEGA beams, without beam smoothing, were typically incident on the gold foils. The total energy was 1500 J, and the focused intensity was 6x10 13 Wcm -2 . The 5.8x magnified images were recorded by a gated framing camera at various times during the 3-ns laser pulse. A pinhole camera imaged the x-ray emission in the energy range of >2 keV. On a spatial scale of 10 μm, it was found that the soft-x-ray images at 257 eV were quite uniform and featureless. In contrast, the hard-x-ray images in the energy range of >2 kev were highly nonuniform with numerous features of size 150 μm. copyright 1998 Optical Society of America

Image processing for grazing incidence fast atom diffraction

Energy Technology Data Exchange (ETDEWEB)

Debiossac, Maxime; Roncin, Philippe, E-mail: philippe.roncin@u-psud.fr

2016-09-01

Grazing incidence fast atom diffraction (GIFAD, or FAD) has developed as a surface sensitive technique. Compared with thermal energies helium diffraction (TEAS or HAS), GIFAD is less sensitive to thermal decoherence but also more demanding in terms of surface coherence, the mean distance between defects. Such high quality surfaces can be obtained from freshly cleaved crystals or in a molecular beam epitaxy (MBE) chamber where a GIFAD setup has been installed allowing in situ operation. Based on recent publications by Atkinson et al. (2014) and Debiossac et al. (2014), the paper describes in detail the basic steps needed to measure the relative intensities of the diffraction spots. Care is taken to outline the underlying physical assumptions.

Observation and resonant x-ray optical interpretation of multi-atom resonant photoemission effects in O 1s emission from NiO

International Nuclear Information System (INIS)

Mannella, N.; Yang, S.-H.; Mun, B.S.; Garcia de Abajo, F.J.; Kay, A.W.; Sell, B.C.; Watanabe, M.; Ohldag, H.; Arenholz, E.; Young, A.T.; Hussain, Z.; Van Hove, M.A.; Fadley, C.S.

2006-01-01

We present experimental and theoretical results for the variation of the O 1s intensity from a NiO(001) surface as the excitation energy is varied through the Ni 2p1/2,3/2 absorption resonances, and as the incidence angle of the radiation is varied from grazing to larger values. For grazing incidence, a strong multi-atom resonant photoemission(MARPE) effect is seen on the O 1s intensity as the Ni 2p resonances are crossed, but its magnitude decreases rapidly as the incidence angle is increased. Resonant x-ray optical (RXRO) calculations are found to predict these effects very well, although the experimental effects are found to decrease at higher incidence angles faster than those in theory. The potential influence of photoelectron diffraction effects on such measurements are also considered, including experimental data with azimuthal-angle variation and corresponding multiple-scattering-diffraction calculations, but we conclude that they do not vary beyond what is expected on the basis of the change in photoelectron kinetic energy. Varying from linear polarization to circular polarization is found to enhance these effects in NiO considerably, although the reasons are not clear. We also discuss the relationship of these measurements to other related interatomic resonance experiments and theoretical developments, and make some suggestions for future studies in this area

Miniaturized High-Speed Modulated X-Ray Source

Science.gov (United States)

Gendreau, Keith C. (Inventor); Arzoumanian, Zaven (Inventor); Kenyon, Steven J. (Inventor); Spartana, Nick Salvatore (Inventor)

2015-01-01

A miniaturized high-speed modulated X-ray source (MXS) device and a method for rapidly and arbitrarily varying with time the output X-ray photon intensities and energies. The MXS device includes an ultraviolet emitter that emits ultraviolet light, a photocathode operably coupled to the ultraviolet light-emitting diode that emits electrons, an electron multiplier operably coupled to the photocathode that multiplies incident electrons, and an anode operably coupled to the electron multiplier that is configured to produce X-rays. The method for modulating MXS includes modulating an intensity of an ultraviolet emitter to emit ultraviolet light, generating electrons in response to the ultraviolet light, multiplying the electrons to become more electrons, and producing X-rays by an anode that includes a target material configured to produce X-rays in response to impact of the more electrons.

Grain orientation mapping of passivated aluminum interconnect wires with X-ray micro-diffraction

International Nuclear Information System (INIS)

MacDowell, A.A.; Padmore, H.A.; Thompson, A.C.; Chang, C.H.; Patel, J.R.

1998-06-01

A micro x-ray diffraction facility is under development at the Advanced Light source. Spot sizes are typically about 1-microm size generated by means of grazing incidence Kirkpatrick-Baez focusing mirrors. Photon energy is either white of energy range 6--14 keV or monochromatic generated from a pair of channel cut crystals. A Laue diffraction pattern from a single grain in passivated 2-microm wide bamboo structured Aluminum interconnect line has been recorded. Acquisition times are of the order of a few seconds. The Laue pattern has allowed the determination of the crystallographic orientation of individual grains along the line length. The experimental and analysis procedures used are described, as is a grain orientation result. The future direction of this program is discussed in the context of strain measurements in the area of electromigration

Characterizing morphology in organic systems with resonant soft X-ray scattering

International Nuclear Information System (INIS)

Carpenter, Joshua H.; Hunt, Adrian; Ade, Harald

2015-01-01

Highlights: • A brief history of the development of R-SoXS for studying soft matter systems. • A theoretical background and an overview of analysis methodology. • Applications to block copolymers, organic electronics, and biological systems. • A discussion of emerging applications and an outlook on the future of R-SoXS. - Abstract: Resonant soft X-ray scattering (R-SoXS) has proven to be a highly useful technique for studying the morphology of soft matter thin films due to the large intrinsic contrast between organic materials and the anisotropic nature of the resonant electronic state transitions from which the contrast originates. This allows R-SoXS users to measure spatial composition correlations from crystalline and amorphous phases in heterogeneous organic samples, infer relative domain purity, and determine average local molecular ordering correlations. R-SoXS has been used to study the morphology of organic photovoltaics, organic thin film transistors, biological systems, and block copolymer engineering applications. The mesoscopic morphological information compliments molecular packing information determined with hard X-rays, so that complex structure–property relationships can be elucidated over a large range of length scales. Extensions of R-SoXS have also emerged that make use of more advanced sample setups or different experimental geometries than normal transmission, such as θ–2θ reflectivity or grazing incidence.

Coating Thin Mirror Segments for Lightweight X-ray Optics

Science.gov (United States)

Chan, Kai-Wing; Sharpe, Marton V.; Zhang, William; Kolosc, Linette; Hong, Melinda; McClelland, Ryan; Hohl, Bruce R.; Saha, Timo; Mazzarellam, James

2013-01-01

Next generations lightweight, high resolution, high throughput optics for x-ray astronomy requires integration of very thin mirror segments into a lightweight telescope housing without distortion. Thin glass substrates with linear dimension of 200 mm and thickness as small as 0.4 mm can now be fabricated to a precision of a few arc-seconds for grazing incidence optics. Subsequent implementation requires a distortion-free deposition of metals such as iridium or platinum. These depositions, however, generally have high coating stresses that cause mirror distortion. In this paper, we discuss the coating stress on these thin glass mirrors and the effort to eliminate their induced distortion. It is shown that balancing the coating distortion either by coating films with tensile and compressive stresses, or on both sides of the mirrors is not sufficient. Heating the mirror in a moderately high temperature turns out to relax the coated films reasonably well to a precision of about a second of arc and therefore provide a practical solution to the coating problem.

Nested grazing incidence optics for x ray detection

Science.gov (United States)

Li, Lin-Sen; Qiang, Peng-Fei; Sheng, Li-Zhi; Liu, Yong-An; Liu, Zhe; Liu, Duo; Zhao, Bao-Sheng; Zhang, Chun-Min

2017-09-01

Not Available Project supported by the National Natural Science Foundation of China (Grant No. 61471357) and the State Key Laboratory of Geo-Information Engineering Foundation (Grant No. SKLGIE2014-M-2-1).

Scattering of x rays from low-Z materials

International Nuclear Information System (INIS)

Gaines, J.L.; Kissel, L.D.; Catron, H.C.; Hansen, R.A.

1980-01-01

X rays incident on thin beryllium, boron, carbon, and other low-Z materials undergo both elastic and inelastic scattering as well as diffraction from the crystalline or crystalline-like structure of the material. Unpolarized monoenergetic x rays in the 1.5 to 8.0-keV energy range were used to determine the absolute scattering efficiency of thin beryllium, carbon, and boron foils. These measurements are compared to calculated scattering efficiencies predicted by single-atom theories. In addition, the relative scattering efficiency versus x-ray energy was measured for other low-Z foils using unpolarized bremsstrahlung x rays. In all the low-Z foils examined, we observed Bragg-like x-ray diffraction due to the ordered structure of the materials

X-ray scattering in giant magneto-resistive multilayers

International Nuclear Information System (INIS)

Fulthorpe, B.D.

1999-01-01

The scattering mechanisms responsible for Giant Magneto-Resistance (GMR) in magnetic multilayers are believed to be related to many aspects of the multilayer structure. X-ray scattering techniques provide a powerful method with which to study the bulk and interface morphology in these systems, and are therefore crucial in developing an understanding of the dominant factors influencing the magnitude of the GMR. Reflectivity measurements performed on a series of Co/Cu multilayers, sputter deposited onto etched silicon, reveal no variation in the interface roughness with etching voltage, the thickness of the individual layers also remaining constant. The observed decrease in the GMR cannot, therefore, be attributed to variations in spacer thickness or interfacial spin-independent scattering. Electron and X-ray Diffraction measurements suggest the reduction in GMR is due to a loss of antiferromagnetic coupling associated with a transformation of the texture from a randomly oriented to well oriented (111) polycrystalline texture, and subsequent reduction in the volume fraction of (100) oriented grains. Interfaces within Co/Cu are found to propagate with a high degree of conformality with increasing bilayer number, with an out-of-plane correlation length well in excess of 300A. In contrast, the Co/Pt system exhibits a limiting out-of-plane correlation length of the order of 350A arising from a columnar growth mode. X-ray Reflectivity and Diffraction measurements provide' no structural interpretation for the 3-fold enhancement in the rate of increase of the saturation conductivity, as a function of spacer thickness, in Fe/Au (100) compared to Fe/Au (111), or why large oscillations in the GMR occur for the (100) orientation only. Such observations are, however, consistent with the existence of a channelling mechanism in Fe/Au (100). Grazing Incidence Fluorescence data indicates that Nb acts as a surfactant in Fe/Au (111) growth on sapphire. The influence of different

Look fast: Crystallization of conjugated molecules during solution shearing probed in-situ and in real time by X-ray scattering

KAUST Repository

Smilgies, Detlef Matthias

2012-12-20

High-speed solution shearing, in which a drop of dissolved material is spread by a coating knife onto the substrate, has emerged as a versatile, yet simple coating technique to prepare high-mobility organic thin film transistors. Solution shearing and subsequent drying and crystallization of a thin film of conjugated molecules is probed in situ using microbeam grazing incidence wide-angle X-ray scattering (μGIWAXS). We demonstrate the advantages of this approach to study solution based crystal nucleation and growth, and identify casting parameter combinations to cast highly ordered and laterally aligned molecular thin films. Copyright © 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Look fast: Crystallization of conjugated molecules during solution shearing probed in-situ and in real time by X-ray scattering

KAUST Repository

Smilgies, Detlef Matthias; Li, Ruipeng; Giri, Gaurav; Chou, Kang Wei; Diao, Ying; Bao, Zhenan; Amassian, Aram

2012-01-01

High-speed solution shearing, in which a drop of dissolved material is spread by a coating knife onto the substrate, has emerged as a versatile, yet simple coating technique to prepare high-mobility organic thin film transistors. Solution shearing and subsequent drying and crystallization of a thin film of conjugated molecules is probed in situ using microbeam grazing incidence wide-angle X-ray scattering (μGIWAXS). We demonstrate the advantages of this approach to study solution based crystal nucleation and growth, and identify casting parameter combinations to cast highly ordered and laterally aligned molecular thin films. Copyright © 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Angular Distributions of Sputtered Atoms from Semiconductor Targets at Grazing Ion Beam Incidence Angles

International Nuclear Information System (INIS)

Sekowski, M.; Burenkov, A.; Martinez-Limia, A.; Hernandez-Mangas, J.; Ryssel, H.

2008-01-01

Angular distributions of ion sputtered germanium and silicon atoms are investigated within this work. Experiments are performed for the case of grazing ion incidence angles, where the resulting angular distributions are asymmetrical with respect to the polar angle of the sputtered atoms. The performed experiments are compared to Monte-Carlo simulations from different programs. We show here an improved model for the angular distribution, which has an additional dependence of the ion incidence angle.

Cholesterol monohydrate nucleation in ultrathin films on water

DEFF Research Database (Denmark)

Rapaport, H.; Kuzmenko, I.; Lafont, S.

2001-01-01

The growth of a cholesterol crystalline phase, three molecular layers thick at the air-water interface, was monitored by grazing incidence x-ray diffraction and x-ray reflectivity. Upon compression, a cholesterol film transforms from a monolayer of trigonal symmetry and low crystallinity to a tri......The growth of a cholesterol crystalline phase, three molecular layers thick at the air-water interface, was monitored by grazing incidence x-ray diffraction and x-ray reflectivity. Upon compression, a cholesterol film transforms from a monolayer of trigonal symmetry and low crystallinity...... in pathological lipid deposits....

Effect of forage supplements on the incidence of bloat in dairy cows grazing high clover pastures.

Science.gov (United States)

Phillips, C J; James, N L; Murray-Evans, J P

1996-08-17

The effect of offering forage supplements of different compositions was examined in two experiments with cows grazing high clover swards. In the first experiment strawmix supplements of high or low energy content (11 and 9 MJ metabolisable energy/kg dry matter [DM]) and high or low crude protein content (17 and 4 g/kg DM) were offered for periods of three weeks. The energy and protein contents were varied by the content of molasses and soyabean meal, respectively. The high energy, high protein supplement increased the incidence of bloat, and the low energy, high protein supplement reduced it, compared with grazing alone. Bloat was most evident in the first two weeks of each feeding period, suggesting that the cows partially adapted to the diets within three weeks. In the second experiment silage supplements reduced the incidence of bloat among cows grazing both tall and short swards. The most suitable forages to feed when there is a risk of bloat are those that are slowly fermented in the rumen but are eaten in sufficient quantity to reduce periods of rapid herbage intake.

Guiding hard x rays with glass polycapillary fiber

International Nuclear Information System (INIS)

Xiao, Q.F.; Ponomarev, I.Y.; Kolomitsev, A.I.; Gibson, D.M.; Dilmanian, F.A.; Nachaliel, E.

1993-01-01

X rays can be guided through a polycapillary fiber by multiple total reflections from the smooth channel walls of the fiber. Using monochromatic Synchrotron Radiation at energies of 22 and 44 keV, we measured the efficiency of transmission of x rays through polycapillary fibers with channel diameters of about 13 μm. Efficiencies of 57.3% and 54.5% for 22 keV and 44 keV x rays, respectively, were obtained with a 120-mm-long straight polycapillary fiber aligned with the incident beam. These values are close to the open fraction of the fiber, which is about 60%. In addition, transmission efficiency was measured as a function of the tilt angle between the incident beam and the axis of the fiber. We also measured the transmission efficiency as a function of the deflection angle for a 114-mm-long curved polycapillary fiber. The measurements are compared with a ray-tracing simulation

Trapping mechanisms in scattering of beams at grazing incidence from crystals

International Nuclear Information System (INIS)

Smith, R.; O'Connor, D.J.; Felsobuki, E.I. von-Nagy

1993-01-01

The trajectories of grazing incidence, 1 keV beams of Si incident on Cu{111} are investigated by means of molecular dynamics (MD) simulations and the conditions under which atoms in the beam can be trapped in the surface binding potential are investigated. The binding potentials for the Cu-Si dimers are calculated using ab initio methods for the neutral, anion and cation. These calculations estimate the binding potential and equilibrium separation for the potential used for the MD calculations. It is found that at 4 o incidence to the Cu{111} face, no trapping occurs for a perfect crystal surface undergoing no thermal vibrations. Trapping can occur for the Si neutral if thermal vibrations are included in the model. Trapping is predicted to occur near steps on the Cu{111} face but these are fairly rare events for the Si - particles. (Author)

X-ray diffraction analysis of InAs nanowires

International Nuclear Information System (INIS)

Davydok, Anton

2013-01-01

Semiconductor nanowires have attracted great interest as building blocks for future electronic and optoelectronic devices. The variability of the growth process opens the opportunity to control and combine the various properties tailoring for specific application. It was shown that the electrical and optical characteristics of the nanowires are strongly connected with their structure. Despite intensive research in this field, the growth process is still not fully understood. In particular, extensive real structure investigations are required. Most of the reports dedicated on the structural researches are based on the results of scanning electron microscopy (SEM) or transmission electron microscopy (TEM). SEM provides an image of the surface with nanostructures and is mainly used to describe the morphology of the sample, but it does not bring information about the internal structure, phase composition and defect structure. At the same time, the internal structure can be examined by TEM down to atomic scale. TEM image of good quality are very expensive due to the efforts in sample preparation and in localisation of a single object. All these aspects make the statistical structural analysis difficult. In the present work, X-ray diffraction analysis has been applied for structural investigation of InAs nanowires grown by different techniques. Using various X-ray diffraction geometries, the nanowire systems were investigated in terms of the lattice parameters, phase composition, strains and displacement fields and stacking defects. In particular, realizing grazing incidence diffraction and controlling the penetration depth of X-ray beam, we characterized sample series grown by Au-assisted metal organic phase epitaxy on GaAs [111]B substrate with different growth time. According to the results of SEM and X-ray investigations, a model of the growth process has been proposed. A more detailed analysis was performed on InAs nanowires grown by molecular beam epitaxy (MBE) on

Determination of global and local residual stresses in SOFC by X-ray diffraction

International Nuclear Information System (INIS)

Villanova, Julie; Sicardy, Olivier; Fortunier, Roland; Micha, Jean-Sebastien; Bleuet, Pierre

2010-01-01

Solid Oxide Fuel Cell (SOFC) is a high-performance electrochemical device for energy conversion. A single cell is composed of five layers made of different ceramic materials: anode support, anode functional layer, electrolyte, cathode functional layer and cathode. The mechanical integrity of the cell is a major issue during its lifetime, especially for the electrolyte layer. Damage of the cells is mainly due to the high operating temperature, the 'redox' behaviour of the anode and the brittleness of the involved materials. Since residual stresses are known to play a significant role in the damage evolution, it is important to determine them. For this purpose, residual stresses in an anode-supported planar SOFC were measured by X-ray diffraction. Firstly, macroscopic stresses in each phase of each layer were studied using the sin 2 ψ method on a laboratory X-ray goniometer at room temperature. This technique enables the calculation of residual stress of the material from the measurement of the crystal lattice deformation. The electrolyte has been found under bi-axial compressive stress of -920 MPa. Secondly, X-ray measurements controlling depth penetration were made in the electrolyte using grazing incidence method. The results show that the stress is not homogenous in the layer. The first five micrometers of the electrolyte have been found less constrained (-750 MPa) than the complete layer, suggesting a gradient of deformation in the electrolyte from the interface with the Anode Functional Layer to the free surface. Finally, local stress measurements were made on the electrolyte layer by X-ray synchrotron radiation that allows high accuracy measurement on the (sub-) micrometer scale. Polychromatic and monochromatic beams are used to determine the complete strain tensor from grain to grain in the electrolyte. First results confirm the macroscopic stress trend of the electrolyte. These X-ray techniques at different scales will contribute to a better understanding

Simulation study of two-energy X-ray fluorescence holograms reconstruction algorithm to remove twin images

International Nuclear Information System (INIS)

Xie Honglan; Hu Wen; Luo Hongxin; Deng Biao; Du Guohao; Xue Yanling; Chen Rongchang; Shi Shaomeng; Xiao Tiqiao

2008-01-01

Unlike traditional outside-source holography, X-ray fluorescence holography is carded out with fluorescent atoms in a sample as source light for holographic imaging. With the method, three-dimensional arrangement of atoms into crystals can be observed obviously. However, just like traditional outside-source holography, X-ray fluorescence holography suffers from the inherent twin-image problem, too. With a 27-Fe-atoms cubic lattice as model, we discuss in this paper influence of the photon energy of incident source in removing twin images in reconstructed atomic images by numerical simulation and reconstruction with two-energy X-ray fluorescence holography. The results indicate that incident X-rays of nearer energies have better effect of removing twin images. In the detector of X-ray holography, minimum difference of the two incident energies depends on energy resolution of the monochromator and detector, and for inside source X-ray holography, minimum difference of the two incident energies depends on difference of two neighboring fluorescent energies emitting from the element and energy resolution of detector. The spatial resolution of atomic images increases with the incident energies. This is important for experiments of X-ray fluorescence holography, which is being developed on Shanghai Synchrotron Radiation Facility. (authors)

Effect of surface roughness on takeoff-angle-dependent X-ray fluorescence of ultrathin films at glancing incidence

International Nuclear Information System (INIS)

Tsuji, Kouichi; Hirokawa, Kichinosuke; Sasaki, Atsushi.

1994-01-01

We had previously shown that takeoff-angle-dependent X-ray fluorescence (TAD-XRF) at glancing incidence is a useful method for the characterization of thin films. Here we report the effect of surface roughness of the substrate on TAD-XRF of an ultrathin film at a glancing incidence. An optically flat glass, scratched glasses and plano-convex lenses were used as substrates. A large-range contour such as warp and a roughness of microscopic scale affect the TAD-XRF profile. Therefore, to characterize the ultrathin film by the TAD-XRF method, the material whose roughness is being investigated should be used as the substrate in TAD-XRF measurement. (author)

Surface and interface strains studied by x-ray diffraction

International Nuclear Information System (INIS)

Akimoto, Koichi; Emoto, Takashi; Ichimiya, Ayahiko

1998-01-01

The authors have developed a technique of X-ray diffraction in order to measure strain fields near semiconductor surface and interface. The diffraction geometry is using the extremely asymmetric Bragg-case bulk reflection of a small incident angle to the surface and a large angle exiting from the surface. The incident angle of the X-rays is set near critical angle of total reflection by tuning X-ray energy of synchrotron radiation at the Photon Factory, Japan. For thermally grown-silicon oxide/Si(100) interface, the X-ray intensity of the silicon substrate 311 reflection has been measured. From comparison of the full width at half maxima (FWHM) of X-ray rocking curves of various thickness of silicon oxides, it has been revealed that silicon substrate lattice is highly strained in the thin (less than about 5 nm) silicon oxide/silicon system. In order to know the original silicon surface strain, the authors have also performed the same kind of measurements in the ultra-high vacuum chamber. A clean Si(111) 7x7 surface gives sharper X-ray diffraction peak than that of the native oxide/Si(111) system. From these measurements, it is concluded that the thin silicon oxide film itself gives strong strain fields to the silicon substrates, which may be the reason of the existence of the structural transition layer at the silicon oxide/Si interface

X-ray diffraction and molecular-dynamics studies: Structural analysis of phases in diglyceride monolayers

DEFF Research Database (Denmark)

Peters, Günther H.J.; Larsen, Niels Bent; Bjørnholm, T.

1998-01-01

We report a detailed structural analysis of the phases of 1,2-sn-dipalmitoylglycerol Langmuir monolayers at room temperature. Pressure-induced transitions have been investigated by combination of molecular-dynamics simulations and grazing-incidence x-ray diffraction (XRD). The diglyceride film...... undergoes two phase transitions occurring at 38.3 and 39.8 Angstrom(2)/molecule. Simulation indicates that the first transition involves a reorientation of the headgroups while simulation and XRD show that in the second transition the order parameter is the tilt angle of the alkyl chains. A methodology......; At the lowest pressure the tilt angle reaches approximate to 14 degrees in a direction close to a nearest neighbor direction. Both arrangements of the alkyl chains are confirmed by XRD. For higher order and fractional order Bragg peaks, simulations predict higher intensities than observed with XRD. This may...

X-ray absorption anisotropy for polychromatic illumination-Crystal views from inside

International Nuclear Information System (INIS)

Korecki, P.; Tolkiehn, M.; Novikov, D.V.

2009-01-01

We review an atomic resolution imaging method based on the analysis of the fine structure in X-ray absorption anisotropy, which results from incident beam diffraction. For a polychromatic X-ray beam, due to the suppression of higher order diffraction fringes, X-ray absorption anisotropy patterns can be interpreted as distorted real-space projections of the atomic structure around absorbing atoms. A qualitative method for analysis of X-ray absorption anisotropy patterns is presented, based on modeling of X-ray patterns with ray-traced images calculated for clusters around absorbing atoms.

X-rays and photocarcinogenesis in hairless mice.

Science.gov (United States)

Lerche, Catharina M; Philipsen, Peter A; Wulf, Hans Christian

2013-08-01

It is well known that excessive X-ray radiation can cause non-melanoma skin cancers. With the increased incidence of sun-related skin cancer there is a need to investigate the combination of sunlight and X-rays. Immunocompetent C3.Cg/TifBomTac mice (n = 298) were divided into 12 groups. Mice were irradiated with 12, 29 or 50 kV X-rays. The mice received a total dose of 45 Gy. They were irradiated with 3 SED simulated solar radiation (SSR) either before or after irradiation with X-rays. The groups irradiated with X-rays alone, 0, 3, 9 and 10 mice (0, 12, 29 and 50 kV, respectively) developed squamous cell carcinoma. In the groups irradiated with SSR after X-rays the development of tumours was significantly faster in the 50 kV group than in the corresponding control group (175 vs. 194 days, p X-ray radiation the development of tumours was significantly faster in the 29 and the 50 kV groups than in the corresponding control group (175 vs. 202 days, p X-ray radiation alone is a weak carcinogen in hairless mice. There is an added carcinogenic effect if X-ray radiation is given on prior sun-exposed skin or if the skin is sun-exposed after X-rays. We still believe that X-ray radiation is a safe and effective therapy for various dermatological diseases but caution should be observed if a patient has severely sun-damaged skin or has a high-risk sun behaviour.

X-ray analysis of temperature induced defect structures in boron implanted silicon

Science.gov (United States)

Sztucki, M.; Metzger, T. H.; Kegel, I.; Tilke, A.; Rouvière, J. L.; Lübbert, D.; Arthur, J.; Patel, J. R.

2002-10-01

We demonstrate the application of surface sensitive diffuse x-ray scattering under the condition of grazing incidence and exit angles to investigate growth and dissolution of near-surface defects after boron implantation in silicon(001) and annealing. Silicon wafers were implanted with a boron dose of 6×1015 ions/cm2 at 32 keV and went through different annealing treatments. From the diffuse intensity close to the (220) surface Bragg peak we reveal the nature and kinetic behavior of the implantation induced defects. Analyzing the q dependence of the diffuse scattering, we are able to distinguish between point defect clusters and extrinsic stacking faults on {111} planes. Characteristic for stacking faults are diffuse x-ray intensity streaks along directions, which allow for the determination of their growth and dissolution kinetics. For the annealing conditions of our crystals, we conclude that the kinetics of growth can be described by an Ostwald ripening model in which smaller faults shrink at the expense of the larger stacking faults. The growth is found to be limited by the self-diffusion of silicon interstitials. After longer rapid thermal annealing the stacking faults disappear almost completely without shrinking, most likely by transformation into perfect loops via a dislocation reaction. This model is confirmed by complementary cross-sectional transmission electron microscopy.

Laboratory soft x-ray microscopy and tomography

International Nuclear Information System (INIS)

Bertilson, Michael

2011-01-01

Soft x-ray microscopy in the water-window (λ = 2.28 nm - 4.36 nm) is based on zone-plate optics and allows high-resolution imaging of, e.g., cells and soils in their natural or near-natural environment. Three-dimensional imaging is provided via tomographic techniques, soft x-ray cryo tomography. However, soft x-ray microscopes with such capabilities have been based on large-scale synchrotron x-ray facilities, thereby limiting their accessibility for a wider scientific community. This Thesis describes the development of the Stockholm laboratory soft x-ray microscope to three-dimensional cryo tomography and to new optics-based contrast mechanisms. The microscope relies on a methanol or nitrogen liquid-jet laser-plasma source, normal-incidence multilayer or zone-plate condenser optics, in-house fabricated zone-plate objectives, and allows operation at two wavelengths in the water-window, λ = 2.48 nm and λ = 2.48 nm. With the implementation of a new state-of-the-art normal-incidence multilayer condenser for operation at λ = 2.48 nm and a tiltable cryogenic sample stage the microscope now allows imaging of dry, wet or cryo-fixed samples. This arrangement was used for the first demonstration of laboratory soft x-ray cryo microscopy and tomography. The performance of the microscope has been demonstrated in a number of experiments described in this Thesis, including, tomographic imaging with a resolution of 140 nm, cryo microscopy and tomography of various cells and parasites, and for studies of aqueous soils and clays. The Thesis also describes the development and implementation of single-element differential-interference and Zernike phase-contrast zone-plate objectives. The enhanced contrast provided by these optics reduce exposure times or lowers the dose in samples and are of major importance for harder x-ray microscopy. The implementation of a high-resolution 50 nm compound zone-plate objective for sub-25-nm resolution imaging is also described. All experiments

Small Angle X-Ray Scattering Detector

Energy Technology Data Exchange (ETDEWEB)

Hessler, Jan P.

2004-06-15

A detector for time-resolved small-angle x-ray scattering includes a nearly constant diameter, evacuated linear tube having an end plate detector with a first fluorescent screen and concentric rings of first fiber optic bundles for low angle scattering detection and an annular detector having a second fluorescent screen and second fiber optic bundles concentrically disposed about the tube for higher angle scattering detection. With the scattering source, i.e., the specimen under investigation, located outside of the evacuated tube on the tube's longitudinal axis, scattered x-rays are detected by the fiber optic bundles, to each of which is coupled a respective photodetector, to provide a measurement resolution, i.e., dq/q, where q is the momentum transferred from an incident x-ray to an x-ray scattering specimen, of 2% over two (2) orders of magnitude in reciprocal space, i.e., qmax/qmin approx=lO0.

Determination of electronic and atomic properties of surface, bulk and buried interfaces: Simultaneous combination of hard X-ray photoelectron spectroscopy and X-ray diffraction

Energy Technology Data Exchange (ETDEWEB)

Rubio-Zuazo, J., E-mail: rubio@esrf.fr [SpLine, Spanish CRG BM25 Beamline at the ESRF, ESRF, B.P. 220, F-38043 Grenoble (France); Instituto de Ciencia de Materiales de Madrid, ICMM, CSIC, Cantoblanco, E-28049 Madrid (Spain); Castro, G.R. [SpLine, Spanish CRG BM25 Beamline at the ESRF, ESRF, B.P. 220, F-38043 Grenoble (France); Instituto de Ciencia de Materiales de Madrid, ICMM, CSIC, Cantoblanco, E-28049 Madrid (Spain)

2013-10-15

Highlights: •We have developed a novel and exceptional tool for non-destructive characterization of bulk and buried interfaces that combine XRD and HAXPES. •We studied the correlation between the atomic, electronic and transport properties of oxygen deficient manganite thin films. •The diffraction data showed a cooperative tilt of the MnO{sub 6} block along the out-of-plane direction. •We shown the absence of the conventional basal plane rotation for the oxygen deficient samples. -- Abstract: Hard X-ray photoelectron spectroscopy (HAXPES) is a powerful novel emerging technique for bulk compositional, chemical and electronic properties determination in a non-destructive way. It benefits from the exceptionally large escape depth of high kinetic energy photoelectrons enabling the study of bulk and buried interfaces up to several tens of nanometres depth. Its advantage over conventional XPS is based on the long mean free path of high kinetic energetic photoelectrons. Using the advantage of tuneable X-ray radiation provided by synchrotron sources the photoelectron kinetic energy, i.e. the information depth can be changed and consequently electronic and compositional depth profiles can be obtained. The combination of HAXPES with an atomic structure sensitive technique, as X-ray diffraction, opens a new research field with great potential for many systems in which their electronic properties are intimately linked to their crystallographic structure. At SpLine, the Spanish CRG Beamline at the European Synchrotron Radiation Facility (ESRF) we have developed a novel and exceptional set-up that combine grazing incidence X-ray diffraction (GIXRD) and HAXPES. Both techniques can be operated simultaneously on the same sample and using the same excitation source. The set-up includes a heavy 2S+3D diffractometer and UHV chamber equipped with an electrostatic analyzer. The UHV chamber has also MBE evaporation sources, an ion gun, a LEED optic, a sample heating and cooling

X-ray spectrometry with synchrotron radiation; Roentgenspektrometrie mit Synchrotronstrahlung

Energy Technology Data Exchange (ETDEWEB)

Mueller, Matthias [Physikalisch-Technische Bundesanstalt (PTB), Berlin (Germany). Arbeitsgruppe ' Roentgen- und IR-Spektrometrie' ; Gerlach, Martin; Holfelder, Ina; Hoenicke, Philipp; Lubeck, Janin; Nutsch, Andreas; Pollakowski, Beatrix; Streeck, Cornelia; Unterumsberger, Rainer; Weser, Jan; Beckhoff, Burkhard

2014-12-15

The X-ray spectrometry of the PTB at the BESSY II storage ring with radiation in the range from 78 eV to 10.5 keV is described. After a description of the instrumentation development reference-sample free X-ray fluorescence analysis, the determination of fundamental atomic parameters, X-ray fluorescence analysis under glance-angle incidence, highly-resolving absorption spectrometry, and emission spectrometry are considered. Finally liquid cells and in-situ measurement techniques are described. (HSI)

Development of Small-Pixel CZT Detectors for Future High-Resolution Hard X-ray Missions

Science.gov (United States)

Beilicke, Matthias

Owing to recent breakthroughs in grazing incidence mirror technology, next-generation hard X-ray telescopes will achieve angular resolutions of between 5 and 10 arc seconds - about an order of magnitude better than that of the NuSTAR hard X-ray telescope. As a consequence, the next generation of hard X-ray telescopes will require pixelated hard X- ray detectors with pixels on a grid with a lattice constant of between 120 and 240 um. Additional detector requirements include a low energy threshold of less than 5 keV and an energy resolution of less than 1 keV. The science drivers for a high angular-resolution hard X-ray mission include studies and measurements of black hole spins, the cosmic evolution of super-massive black holes, AGN feedback, and the behavior of matter at very high densities. We propose a R&D research program to develop, optimize and study the performance of 100-200 um pixel pitch CdTe and Cadmium Zinc Telluride (CZT) detectors of 1-2 mm thickness. Our program aims at a comparison of the performance achieved with CdTe and CZT detectors, and the optimization of the pixel, steering grid, and guard ring anode patterns. Although these studies will use existing ASICs (Application Specific Integrated Circuits), our program also includes modest funds for the development of an ultra-low noise ASIC with a 2-D grid of readout pads that can be directly bonded to the 100-200 um pixel pitch CdTe and CZT detectors. The team includes the Washington University group (Prof. M. Beilicke and Co-I Prof. H.S.W. Krawczynski et al.), and co-investigator G. De Geronimo at Brookhaven National Laboratory (BNL). The Washington University group has a 10 year track record of innovative CZT detector R&D sponsored by the NASA Astronomy and Physics Research and Analysis (APRA) program. The accomplishments to date include the development of CZT detectors with pixel pitches between 350 um and 2.5 mm for the ProtoExist, EXIST, and X-Calibur hard X-ray missions with some of the best

Dose-incidence relationships for exencephalia, anophthalmia and prenatal mortality in mouse embryos irradiated with fission neutrons or 250 kV X-rays

Energy Technology Data Exchange (ETDEWEB)

Friedberg, W.; Faulkner, D.N.; Neas, B.R.; Hanneman, G.D.; Darden, E.B. Jr.; Deal, R.B. Jr.; Parker, D.E.

1987-08-01

Groups of pregnant mice were irradiated at selected times between 10.00 hours on gestation day 7 and 16.00 hours on day 8. Each group received 0.39 Gy of neutrons or 1.60 Gy of X-rays, or was sham irradiated. We identified a period of high susceptibility of the embryos to radiation-induced exencephalia, anophthalmia and prenatal mortality early in gestation day 8. Dose-incidence relationships in this period were investigated with 0.19-0.48 Gy of neutrons and with 0.40-2.00 Gy of X-rays.

Dose-incidence relationships for exencephalia, anophthalmia and prenatal mortality in mouse embryos irradiated with fission neutrons or 250 kV X-rays

International Nuclear Information System (INIS)

Friedberg, W.; Faulkner, D.N.; Neas, B.R.; Hanneman, G.D.; Deal, R.B. Jr.; Parker, D.E.

1987-01-01

Groups of pregnant mice were irradiated at selected times between 10.00 hours on gestation day 7 and 16.00 hours on day 8. Each group received 0.39 Gy of neutrons or 1.60 Gy of X-rays, or was sham irradiated. We identified a period of high susceptibility of the embryos to radiation-induced exencephalia, anophthalmia and prenatal mortality early in gestation day 8. Dose-incidence relationships in this period were investigated with 0.19-0.48 Gy of neutrons and with 0.40-2.00 Gy of X-rays. (author)

Picosecond chronography at x-ray wavelengths

International Nuclear Information System (INIS)

Bird, P.R.; Bradley, D.J.; Roddie, A.G.; Sibbett, W.; Key, M.H.; Lamb, M.J.; Lewis, C.L.S.

1975-01-01

An ultrafast streak camera for vacuum U-V to X-ray radiation is described. Preliminary measurements on laser-produced plasmas are presented with time resolution down to 150 psecs and space resolution down to 40μm for 1keV X-ray emission from a plasma generated by 2GW laser pulses focussed on a Cu target. High sensitivity and wide spectral bandwidth is due to front surface photoemission at oblique incidence. Time resolution capability of 40 psec and simultaneous spatial resolution down to a few microns is theoretically possible with this system. (author)

M-shell X-ray production cross-sections for elements with 67 ≤ Z ≤ 92 at incident photon energies EM1inc≤150keV

International Nuclear Information System (INIS)

Chauhan, Yogeshwar; Kumar, Anil; Puri, Sanjiv

2009-01-01

The X-ray production cross-sections for the Mk (k = ξ, δ, α, β, ζ, γ, m 1 and m 2 ) groups of X-rays have been evaluated for all the elements with 67 ≤ Z ≤ 92 at incident photon energies ranging E M 1 inc ≤150 keV using currently available theoretical data sets of different physical parameters, namely, partial photoionization cross-sections, X-ray emission rates, fluorescence and Coster-Kronig yields, and the K-shell/L j (j = 1-3) subshell to the M i (i = 1-5) subshell vacancy transfer probabilities, based on the independent particle models.

X-ray photographs of a solar active region with a multilayer telescope at normal incidence

Science.gov (United States)

Underwood, J. H.; Bruner, M. E.; Haisch, B. M.; Brown, W. A.; Acton, L. W.

1987-01-01

An astronomical photograph was obtained with a multilayer X-ray telescope. A 4-cm tungsten-carbon multilayer mirror was flown as part of an experimental solar rocket payload, and successful images were taken of the sun at normal incidence at a wavelength of 44 A. Coronal Si XII emission from an active region was recorded on film; as expected, the structure is very similar to that observed at O VIII wavelengths by the Solar Maximum Mission flat-crystal spectrometer at the same time. The small, simple optical system used in this experiment appears to have achieved a resolution of 5 to 10 arcsec.

X-ray fluorescence imaging with polycapillary X-ray optics

International Nuclear Information System (INIS)

Yonehara, Tasuku; Yamaguchi, Makoto; Tsuji, Kouichi

2010-01-01

X-ray fluorescence spectrometry imaging is a powerful tool to provide information about the chemical composition and elemental distribution of a specimen. X-ray fluorescence spectrometry images were conventionally obtained by using a μ-X-ray fluorescence spectrometry spectrometer, which requires scanning a sample. Faster X-ray fluorescence spectrometry imaging would be achieved by eliminating the process of sample scanning. Thus, we developed an X-ray fluorescence spectrometry imaging instrument without sample scanning by using polycapillary X-ray optics, which had energy filter characteristics caused by the energy dependence of the total reflection phenomenon. In the present paper, we show that two independent straight polycapillary X-ray optics could be used as an energy filter of X-rays for X-ray fluorescence. Only low energy X-rays were detected when the angle between the two optical axes was increased slightly. Energy-selective X-ray fluorescence spectrometry images with projection mode were taken by using an X-ray CCD camera equipped with two polycapillary optics. It was shown that Fe Kα (6.40 keV) and Cu Kα (8.04 keV) could be discriminated for Fe and Cu foils.

Preoperative chest x-ray findings in peptic ulcer perforation

Energy Technology Data Exchange (ETDEWEB)

Kim, T. H.; Kim, S. W.; Lim, J. S.; Kim, Y. J. [Kyungpook National University School of Medicine, Taegu (Korea, Republic of)

1981-12-15

This study was carried out to analyze the distribution of age, sex, chief complaint, physical examination and findings of chest x-ray films before operation in 59 cases of peptic ulcer perforation. The ratio of male to female was 1.7 : 1 and incidence of the ulcer perforation was most common in 5th decades. Thirty five among 59 cases showed pleural effusion, segmental atelectasis and pneumonic infiltration on chest x-ray film. Twenty nine among 50 cases of duodenal ulcer perforation and 6 of 9 cases of stomach ulcer perforation showed positive chest x-ray findings. No relationship was found between fever and preoperative chest x-ray findings.

Preoperative chest x-ray findings in peptic ulcer perforation

International Nuclear Information System (INIS)

Kim, T. H.; Kim, S. W.; Lim, J. S.; Kim, Y. J.

1981-01-01

This study was carried out to analyze the distribution of age, sex, chief complaint, physical examination and findings of chest x-ray films before operation in 59 cases of peptic ulcer perforation. The ratio of male to female was 1.7 : 1 and incidence of the ulcer perforation was most common in 5th decades. Thirty five among 59 cases showed pleural effusion, segmental atelectasis and pneumonic infiltration on chest x-ray film. Twenty nine among 50 cases of duodenal ulcer perforation and 6 of 9 cases of stomach ulcer perforation showed positive chest x-ray findings. No relationship was found between fever and preoperative chest x-ray findings

Investigation on the properties of a laminar grating as a soft x-ray beam splitter

International Nuclear Information System (INIS)

Liu Ying; Fuchs, Hans-Joerg; Liu Zhengkun; Chen Huoyao; He Shengnan; Fu Shaojun; Kley, Ernst-Bernhard; Tuennermann, Andreas

2010-01-01

Laminar-type gratings as soft x-ray beam splitters for interferometry are presented. Gold-coated grating beam splitters with 1000 lines/mm are designed for grazing incidence operation at 13.9nm. They are routinely fabricated using electron beam lithography and ion etching techniques. The laminar grating is measured to have almost equal absolute efficiencies of about 20% in the zeroth and -1st orders, which enables a fringe visibility up to 0.99 in the interferometer. The discrepancy of the grating profiles between the optimized theoretical and the experimental results is analyzed according to the comparison of the optimized simulation results and the measurement realization of the grating efficiencies. By a precise control of the grating profile, the grating efficiency in the -1st order and the fringe visibility could be improved to 25% and 1, respectively.

Structure of cholesterol/ceramide monolayer mixtures

DEFF Research Database (Denmark)

Scheffer, L.; Solomonov, I.; Weygand, M.J.

2005-01-01

The structure of monolayers of cholesterol/ ceramide mixtures was investigated using grazing incidence x-ray diffraction, immunofluorescence, and atomic force microscopy techniques. Grazing incidence x-ray diffraction measurements showed the existence of a crystalline mixed phase of the two....... As ceramide incorporates the lipid backbone common to all sphingolipids, this arrangement may be relevant to the understanding of the molecular organization of lipid rafts....

Simbol-X Core Science in a Context

Science.gov (United States)

Fiore, F.; Arnaud, M.; Briel, U.; Cavazzuti, E.; Cledassou, R.; Counil, J. L.; Comastri, A.; Ferrando, P.; Giommi, P.; Goldwurm, A.; Lamarle, O.; Lanzuisi, G.; Laurent, P.; Lebrun, F.; Malaguti, G.; Mereghetti, S.; Micela, G.; Pareschi, G.; Piconcelli, E.; Piermaria, M.; Puccetti, S.; Roques, J.-P.; Tagliaferri, G.; Vignali, C.

2009-05-01

Taking advantage of emerging technology in mirror manufacturing and spacecraft formation flying, Simbol-X will push grazing incidence imaging up to ~80 keV, providing an improvement of roughly three orders of magnitude in sensitivity and angular resolution compared to all instruments that have operated so far above 10 keV. This will open a new window in X-ray astronomy, allowing breakthrough studies on black hole physics and census and particle acceleration mechanisms. We discuss here synergies between Simbol-X and the main multiwavelength facilities that will operate in the next decade, and present a quantitative comparison between Simbol-X and its main competitors, NuStar and Astro-H.

Simbol-X Core Science in a Context

International Nuclear Information System (INIS)

Fiore, F.; Lanzuisi, G.; Piconcelli, E.; Arnaud, M.; Briel, U.; Cavazzuti, E.; Giommi, P.; Piermaria, M.; Puccetti, S.; Cledassou, R.; Counil, J. L.; Lamarle, O.; Comastri, A.; Ferrando, P.; Goldwurm, A.; Laurent, P.; Lebrun, F.; Malaguti, G.; Mereghetti, S.; Micela, G.

2009-01-01

Taking advantage of emerging technology in mirror manufacturing and spacecraft formation flying, Simbol-X will push grazing incidence imaging up to ∼80 keV, providing an improvement of roughly three orders of magnitude in sensitivity and angular resolution compared to all instruments that have operated so far above 10 keV. This will open a new window in X-ray astronomy, allowing breakthrough studies on black hole physics and census and particle acceleration mechanisms. We discuss here synergies between Simbol-X and the main multiwavelength facilities that will operate in the next decade, and present a quantitative comparison between Simbol-X and its main competitors, NuStar and Astro-H.

ORNL 10-m small-angle X-ray scattering camera

International Nuclear Information System (INIS)

Hendricks, R.W.

1979-12-01

A new small-angle x-ray scattering camera utilizing a rotating anode x-ray source, crystal monochromatization of the incident beam, pinhole collimation, and a two-dimensional position-sensitive proportional counter was developed. The sample, and the resolution element of the detector are each approximately 1 x 1 mm 2 , the camera was designed so that the focal spot-to-sample and sample-to-detector distances may each be varied in 0.5-m increments up to 5 m to provide a system resolution in the range 0.5 to 4.0 mrad. A large, general-purpose specimen chamber has been provided into which a wide variety of special-purpose specimen holders can be mounted. The detector has an active area of 200 x 200 mm and has up to 200 x 200 resolution elements. The data are recorded in the memory of a minicomputer by a high-speed interface which uses a microprocessor to map the position of an incident photon into an absolute minicomputer memory address. The data recorded in the computer memory can be processed on-line by a variety of programs designed to enhance the user's interaction with the experiment. At the highest angular resolution (0.4 mrad), the flux incident on the specimen is 1.0 x 10 6 photons/s with the x-ray source operating at 45 kV and 100 mA. SAX and its associated programs OVF and MOT are high-priority, pre-queued, nonresident foreground tasks which run under the ModComp II MAX III operating system to provide complete user control of the ORNL 10-m small-angle x-ray scattering camera

Grazing incidence diffraction anomalous fine structure of self-assembled semiconductor nanostructures

International Nuclear Information System (INIS)

Grenier, S.; Letoublon, A.; Proietti, M.G.; Renevier, H.; Gonzalez, L.; Garcia, J.M.; Priester, C.; Garcia, J.

2003-01-01

We have studied self-organized quantum wires of InAs, grown by molecular beam epitaxy onto a InP(0 0 1) substrate, by means of grazing incidence diffraction anomalous fine structure (DAFS). The equivalent quantum wires thickness is 2.5 monolayers. We measured the (4 4 0) and (4 2 0) GIDAFS spectra, at the As K-edge, keeping the incidence and exit angles close to the InP critical angle. The analysis of both the smooth and oscillatory contributions of the DAFS spectrum, provide valuable information about composition and strain inside the quantum wires and close to the interface. We also show preliminary results on InAs wires encapsulated by a 40 A thick InP capping layer, suggesting the DAFS capability of probing different iso-strain regions of the wires

X-Ray Absorption with Transmission X-Ray Microscopes

NARCIS (Netherlands)

de Groot, F.M.F.

2016-01-01

In this section we focus on the use of transmission X-ray microscopy (TXM) to measure the XAS spectra. In the last decade a range of soft X-ray and hard X-ray TXM microscopes have been developed, allowing the measurement of XAS spectra with 10–100 nm resolution. In the hard X-ray range the TXM

Sum rules application to reflectometry of X-ray resonant radiation for magnetic multilayer investigation

International Nuclear Information System (INIS)

Smekhova, A.G.; Andreeva, M.A.

2005-01-01

One elaborated the general formalism on the basis of which one derived the clear expressions for reflection factors of X-ray radiation with a circular polarization from medium magnetized both within surface plane and within reflection plane both for grazing angles and for high grazing angles. The asymmetry of reflection spectra for right- and left-polarized radiation is shown to depend both on nondiagonal components of a susceptibility tensor and on other components in contrast to absorption spectra, so the sum rule to determine the orbital and the spin magnetic moments can not be applied directly to the experimental spectra of reflection [ru

Study on exposures in incidents situations involving X-ray generators of industrial use

International Nuclear Information System (INIS)

Rios, Paulo B.; Rios, Denise A. da S.

2014-01-01

Case studies of accidents involving radiation sources provides valuable information for the improvement of equipment and procedures to be adopted to prevent their recurrence. Therefore, they are recommended as part of the licensing process of radiative facilities. However, when the equipment has no radiological protection requirements or have no record of accidents, an effective method to appropriate this knowledge necessary to improvements of process and project is the investigation of reported incidents and the proposition limit situations where exposures unlikely and even low intensity can occur. This work reviews incidents in X-ray equipment and thickness meters. Emergency situations are also studied in this type of equipment and in an accelerator of electrons self-shielded for curing of paints and varnishes. The exposure estimates are calculated from data collected in workplaces on the distance and time for each proposed case. Although there is no severe consequences to occupational health, the results can be used to improve the quality of training for operators and maintenance technicians, for proposing of new alarm systems and emergency teams procedures and may serve as a warning in inadvertent and avoidable situations of unnecessary exposures

Study of secondary X-rays from radiographic intensifying screens

International Nuclear Information System (INIS)

Barroso, R.C.; Eichler, J.; Lopes, R.T.; Cardoso, S.C.

1998-01-01

To reduce the radiation dose in radiology, fluorescent intensifying screens for X-ray films are used. They produce visible light which increases the efficiency of the film. In addition, there are two other effects that will degrade the image resolution. First, the gadolinium present in the screens produces X-rays isotropically. Second, the primary radiation can be scattered elastically (Rayleigh scattering) and inelastically (Compton scattering). The intensity and angular distribution of these secondary radiation were measured, showing that the ratio of secondary-to-primary radiation incident on the X-ray film is about 16%. (orig.)

X-ray backscatter imaging with a spiral scanner

International Nuclear Information System (INIS)

Bossi, R.H.; Cline, J.L.; Friddell, K.D.

1989-01-01

X-ray backscatter imaging allows radiographic inspections to be performed with access to only one side of the object. A collimated beam of radiation striking an object will scatter x-rays by Compton scatter and x-ray fluorescence. A detector located on the source side of the part will measure the backscatter signal. By plotting signal strength as gray scale intensity vs. beam position on the object, an image of the object can be constructed. A novel approach to the motion of the collimated incident beam is a spiral scanner. The spiral scanner approach, described in this paper, can image an area of an object without the synchronized motion of the object or detector, required by other backscatter imaging techniques. X-ray backscatter is particularly useful for flaw detection in light element materials such as composites. The ease of operation and the ability to operate non-contact from one side of an object make x-ray backscatter imaging of increasing interest to industrial inspection problems

Temporal resolution limit estimation of x-ray streak cameras using a CsI photocathode

Energy Technology Data Exchange (ETDEWEB)

Li, Xiang; Gu, Li; Zong, Fangke; Zhang, Jingjin; Yang, Qinlao, E-mail: qlyang@szu.edu.cn [Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, Institute of Optoelectronics, Shenzhen University, Shenzhen 518060 (China)

2015-08-28

A Monte Carlo model is developed and implemented to calculate the characteristics of x-ray induced secondary electron (SE) emission from a CsI photocathode used in an x-ray streak camera. Time distributions of emitted SEs are investigated with an incident x-ray energy range from 1 to 30 keV and a CsI thickness range from 100 to 1000 nm. Simulation results indicate that SE time distribution curves have little dependence on the incident x-ray energy and CsI thickness. The calculated time dispersion within the CsI photocathode is about 70 fs, which should be the temporal resolution limit of x-ray streak cameras that use CsI as the photocathode material.

SPRED: a multichannel grazing-incidence spectrometer for plasma impurity diagnosis

International Nuclear Information System (INIS)

Fonck, R.J.; Ramsey, A.T.; Yelle, R.V.

1982-03-01

A compact vacuum ultraviolet spectrometer system has been developed to provide time-resolved impurity spectra from tokamak plasmas. Two interchangeable aberration-corrected toroidal diffraction gratings with flat focal fields provide simultaneous coverage over the ranges 100 to 1100 A or 160 to 1700 A. The detector is an intensified self-scanning photodiode array. Spectral resolution is 2 A with the higher dispersion grating. Minimum readout time for a full spectrum is 20 ms, but up to 7 individual spectral lines can be measured with a 1 ms time resolution. The sensitivity of the system is comparable to that of a conventional grazing incidence monochromator

SPRED: a multichannel grazing-incidence spectrometer for plasma impurity diagnosis

Energy Technology Data Exchange (ETDEWEB)

Fonck, R.J.; Ramsey, A.T.; Yelle, R.V.

1982-03-01

A compact vacuum ultraviolet spectrometer system has been developed to provide time-resolved impurity spectra from tokamak plasmas. Two interchangeable aberration-corrected toroidal diffraction gratings with flat focal fields provide simultaneous coverage over the ranges 100 to 1100 A or 160 to 1700 A. The detector is an intensified self-scanning photodiode array. Spectral resolution is 2 A with the higher dispersion grating. Minimum readout time for a full spectrum is 20 ms, but up to 7 individual spectral lines can be measured with a 1 ms time resolution. The sensitivity of the system is comparable to that of a conventional grazing incidence monochromator.

VPD residue search by monitoring scattered x-rays

International Nuclear Information System (INIS)

Mori, Y.; Yamagami, M.; Yamada, T.

2000-01-01

Recently, VPD-TXRF has come into wide use for semiconductor analysis. In VPD-TXRF technique, adjusting the mechanical measuring point to the center of dried residue is of importance for accurate determination. Until now, the following searching methods have been used: monitoring light scattering under bright illumination, using laser scattering particle mapper, applying internal standard as a marker. However, each method has individual disadvantage. For example, interference of Kβ line (ex. Sc-Kβ to Ti-Kα) occurs in the internal standard method. We propose a new searching method 'scattered x-ray search' which utilizes x-ray scattering form the dried residue as a marker. Since the line profile of x-ray scattering agrees with that of fluorescent x-rays, scattered x-ray can be used as an alternative marker instead of internal standard. According to our experimental results, this search method shows the same accuracy as internal standard method. The merits are as follows: 1) no need to add internal standard, 2) rapid search because of high intensity of scattered x-rays, 3) searching software for internal standard can be applied without any modification. In this method, diffraction of incident x-rays by substrate causes irregular change over the detected scattering x-rays. Therefore, this method works better under x-y controlled stage than r-Θ one. (author)

Studying atomic-resolution by X-ray fluorescence holography

International Nuclear Information System (INIS)

Gao Hongyi; Chen Jianwen; Xie Honglan; Zhu Huafeng; Li Ruxin; Xu Zhizhan

2005-01-01

In this work, the results of numerical simulations of X-ray fluorescence holograms and the reconstructed atomic images for Fe single crystal are given. The influences of the recording angles ranges and the polarization effect on the reconstruction of the atomic images are discussed. The process for removing twin images by multiple energy fluorescence holography and expanding the energy range of the incident X-rays to improve the resolution of the reconstructed images is presented

New optical scheme for differential measurements of diffraction reflection intensity on X-radiation sliding incidence

International Nuclear Information System (INIS)

Golovin, A.L.; Mas', E.T.

1989-01-01

An X-ray optical scheme for differential measurements of X-ray diffraction under sliding incidence conditions is proposed and an attachment design realizng this scheme, using standard equipment, is described. The main feature of the scheme is the following: collimation according to the Bragg angle is carried out for the reflected beam rather than the incident one. Goniometers can be used from DRON, TRS, GS-5 and other spectrometers. The goniometer head carrying the sample is standard, it is a part of the DRON, TRS and DTS. The crystal analyzer is fixed on the attachment. The angular position of the crystal monochromator is controlled by an inductive sensor. The experimental differential curves of X-ray diffraction under conditions of sliding incidence, taken for a silicon crystal having the 111 orientation, are given as well

Comparison of simulation to absolute X-ray emission of CH plasma created with the Nike laser

Energy Technology Data Exchange (ETDEWEB)

Busquet, M.; Feldman, U.; Klapisch, M. [ARTEP, Inc., Ellicott City, Maryland (contractor to NRL) (United States); Weaver, J.L.; Colombant, D.G.; Mostovych, A.N. [Naval Research Laboratory, Plasma Physics Division, Washington, DC (United States); Seely, J.F. [Naval Research Laboratory, Space Science Division, Washington, DC (United States); Holland, G. [SFA, Inc., Landover, Maryland (contractor to NRL) (United States)

2006-06-15

The Nike laser group at the Naval Research Laboratory has an ongoing effort to improve and benchmark the radiation hydrodynamic simulations used to develop pellet designs for inertial confinement fusion. A new post-processor, Virtual Spectro, has been added to the FAST code suite for detailed simulation of non-local thermodynamical equilibrium (non-LTE) spectra, including radiation transport effects and Stark line profile. This new combination enhances our ability to predict the absolute emission of soft X-rays. An absolutely calibrated transmission grating spectrometer and a high resolution grazing incidence spectrometer have been used to collect time integrated and time resolved spectra emitted by CH targets irradiated at laser intensities of about 10 TW/cm{sup 2}. Comparison between these observations and simulations using Virtual Spectro demonstrates excellent agreement (within factor of about 1.5) for the absolute emission. (authors)

Comparison of simulation to absolute X-ray emission of CH plasma created with the Nike laser

International Nuclear Information System (INIS)

Busquet, M.; Feldman, U.; Klapisch, M.; Weaver, J.L.; Colombant, D.G.; Mostovych, A.N.; Seely, J.F.; Holland, G.

2006-01-01

The Nike laser group at the Naval Research Laboratory has an ongoing effort to improve and benchmark the radiation hydrodynamic simulations used to develop pellet designs for inertial confinement fusion. A new post-processor, Virtual Spectro, has been added to the FAST code suite for detailed simulation of non-local thermodynamical equilibrium (non-LTE) spectra, including radiation transport effects and Stark line profile. This new combination enhances our ability to predict the absolute emission of soft X-rays. An absolutely calibrated transmission grating spectrometer and a high resolution grazing incidence spectrometer have been used to collect time integrated and time resolved spectra emitted by CH targets irradiated at laser intensities of about 10 TW/cm 2 . Comparison between these observations and simulations using Virtual Spectro demonstrates excellent agreement (within factor of about 1.5) for the absolute emission. (authors)

Hybrid lightweight X-ray optics for half arcsecond imaging

Science.gov (United States)

Reid, Paul

This proposal is for the development of grazing incidence optics suitable to meet the 0.5 arcsec imaging and 2.3 square meter effective area requirements of the X-ray Surveyor mission concept, currently under study by NASA. Our approach is to combine two promising technologies, as yet individually unproven at the 0.5 arcsec level, into a hybrid mirror approach. The two technologies are thin piezoelectric film adjustable optics under development at SAO and PSU, and differential deposition under development at NASA MSFC. These technologies are complementary: adjustable optics are best suited to fixing low spatial frequency errors due to piezoelectric cell size limitations, and differential deposition is best suited for fixing mid-spatial frequency errors so as to limit the amount of material that must be deposited. Thus, the combination of the two techniques extends the bandwidth of figure errors that can be corrected beyond what it was for either individual technique. Both technologies will be applied to fabricate Wolter-I mirror segment from single thermally formed glass substrates. This work is directed at mirror segments only (not full shells), as we believe segments are the most appropriate for developing the 3 m diameter X-ray Surveyor high resolution mirror. In this program we will extend differential deposition to segment surfaces (from line profiles), investigate the most realistic error bandwidths for each technology, and determine the impacts of one technologys processing steps on the other to find if there is an optimal order to combining the technologies. In addition, we will also conduct a conical/cylindrical mirror metrology "round-robin," to cross-calibrate the different cylindrical metrology to one another as a means of minimizing systematic errors. Finally, we will examine the balancing and compensating of mirror stress due to the various thin films employed (piezoelectric layer, differential deposition, X-ray reflecting layer(s)) with an eye to

Surface damage through grazing incidence ions investigated by scanning tunneling microscopy

International Nuclear Information System (INIS)

Redinger, Alex

2009-01-01

Surface damage, caused by grazing incidence ions, is investigated with variable temperature scanning tunneling microscopy. The experiments are carried out on a Pt(111) crystal. The kinetic energy of noble gas ions is varied between 1-15 keV and the angle of incidence can be adjusted between θ = 78.5 and θ = 90 measured with respect to the surface normal. The damage patterns of single ion impacts, on flat terraces and at step edges of monoatomic height, are investigated at low surface temperatures. Ions hitting a flat terrace are usually specular reflected. The energy transfer from the ion to the crystal atoms is small and only little damage is produced. In contrast, at ascending step edges, which are illuminated by the ion beam, large angle scattering events occur. Sputtering, adatom and vacancy production is induced. However, a significant fraction of the ions, which hit step edges, enter the crystal and are guided in between two atomic layers parallel to the surface via small angle binary collisions. This steering process is denoted as subsurface channeling. The energy loss per length scale of the channeled particles is low, which results in long ion trajectories (up to 1000A). During the steering process, the ions produce surface damage. Depending on the ion species and the ion energy, adatom and vacancies or surface vacancy trenches of monoatomic width are observed. The surface damage can be used to track the path of the ion. This makes the whole trajectory of single ions with keV energy visible. The number of sputtered atoms per incident ion at ascending step edges, i.e. the step edge sputtering yield, is measured experimentally for different irradiation conditions. For θ = 86 , the sputtering yield is determined from the fluence dependent retraction of pre-existing illuminated step edges. An alternative method for the step edge sputtering yield determination, is the analysis of the concentration of ascending steps and of the removed amount of material as a

Surface damage through grazing incidence ions investigated by scanning tunneling microscopy

Energy Technology Data Exchange (ETDEWEB)

Redinger, Alex

2009-07-10

Surface damage, caused by grazing incidence ions, is investigated with variable temperature scanning tunneling microscopy. The experiments are carried out on a Pt(111) crystal. The kinetic energy of noble gas ions is varied between 1-15 keV and the angle of incidence can be adjusted between {theta} = 78.5 and {theta} = 90 measured with respect to the surface normal. The damage patterns of single ion impacts, on flat terraces and at step edges of monoatomic height, are investigated at low surface temperatures. Ions hitting a flat terrace are usually specular reflected. The energy transfer from the ion to the crystal atoms is small and only little damage is produced. In contrast, at ascending step edges, which are illuminated by the ion beam, large angle scattering events occur. Sputtering, adatom and vacancy production is induced. However, a significant fraction of the ions, which hit step edges, enter the crystal and are guided in between two atomic layers parallel to the surface via small angle binary collisions. This steering process is denoted as subsurface channeling. The energy loss per length scale of the channeled particles is low, which results in long ion trajectories (up to 1000A). During the steering process, the ions produce surface damage. Depending on the ion species and the ion energy, adatom and vacancies or surface vacancy trenches of monoatomic width are observed. The surface damage can be used to track the path of the ion. This makes the whole trajectory of single ions with keV energy visible. The number of sputtered atoms per incident ion at ascending step edges, i.e. the step edge sputtering yield, is measured experimentally for different irradiation conditions. For {theta} = 86 , the sputtering yield is determined from the fluence dependent retraction of pre-existing illuminated step edges. An alternative method for the step edge sputtering yield determination, is the analysis of the concentration of ascending steps and of the removed amount

X-ray astronomy

International Nuclear Information System (INIS)

Giacconi, R.; Gursky, H.

1974-01-01

This text contains ten chapters and three appendices. Following an introduction, chapters two through five deal with observational techniques, mechanisms for the production of x rays in a cosmic setting, the x-ray sky and solar x-ray emission. Chapters six through ten include compact x-ray sources, supernova remnants, the interstellar medium, extragalactic x-ray sources and the cosmic x-ray background. Interactions of x rays with matter, units and conversion factors and a catalog of x-ray sources comprise the three appendices. (U.S.)

X-Ray Calorimeter Arrays for Astrophysics

Science.gov (United States)

Kilbourne, Caroline A.

2009-01-01

High-resolution x-ray spectroscopy is a powerful tool for studying the evolving universe. The grating spectrometers on the XMM and Chandra satellites started a new era in x-ray astronomy, but there remains a need for instrumentation that can provide higher spectral resolution with high throughput in the Fe-K band (around 6 keV) and can enable imaging spectroscopy of extended sources, such as supernova remnants and galaxy clusters. The instrumentation needed is a broad-band imaging spectrometer - basically an x-ray camera that can distinguish tens of thousands of x-ray colors. The potential benefits to astrophysics of using a low-temperature calorimeter to determine the energy of an incident x-ray photon via measurement of a small change in temperature was first articulated by S. H. Moseley over two decades ago. In the time since, technological progress has been steady, though full realization in an orbiting x-ray telescope is still awaited. A low-temperature calorimeter can be characterized by the type of thermometer it uses, and three types presently dominate the field. The first two types are temperature-sensitive resistors - semiconductors in the metal-insulator transition and superconductors operated in the superconducting-normal transition. The third type uses a paramagnetic thermometer. These types can be considered the three generations of x-ray calorimeters; by now each has demonstrated a resolving power of 2000 at 6 keV, but only a semiconductor calorimeter system has been developed to spaceflight readiness. The Soft X-ray Spectrometer on Astro-H, expected to launch in 2013, will use an array of silicon thermistors with I-IgTe x-ray absorbers that will operate at 50 mK. Both the semiconductor and superconductor calorimeters have been implemented in small arrays, kilo-pixel arrays of the superconducting calorimeters are just now being produced, and it is anticipated that much larger arrays will require the non-dissipative advantage of magnetic thermometers.

High-Resolution X-ray Emission and X-ray Absorption Spectroscopy

NARCIS (Netherlands)

Groot, F.M.F. de

2000-01-01

In this review, high-resolution X-ray emission and X-ray absorption spectroscopy will be discussed. The focus is on the 3d transition-metal systems. To understand high-resolution X-ray emission and reso-nant X-ray emission, it is first necessary to spend some time discussing the X-ray absorption

Simbol-X: a formation flight mission with an unprecedented imaging capability in the 0.5-80 keV energy band

Science.gov (United States)

Tagliaferri, Gianpiero; Ferrando, Philippe; Le Duigou, Jean-Michel; Pareschi, Giovanni; Laurent, Philippe; Malaguti, Giuseppe; Clédassou, Rodolphe; Piermaria, Mauro; La Marle, Olivier; Fiore, Fabrizio; Giommi, Paolo

2017-11-01

The discovery of X-ray emission from cosmic sources in the 1960s has opened a new powerful observing window on the Universe. In fact, the exploration of the X-ray sky during the 70s-90s has established X-ray astronomy as a fundamental field of astrophysics. Today, the emission from astrophysical sources is by large best known at energies below 10 keV. The main reason for this situation is purely technical since grazing incidence reflection has so far been limited to the soft X-ray band. Above 10 keV all the observations have been obtained with collimated detectors or coded mask instruments. To make a leap step forward in Xray astronomy above 10 keV it is necessary to extend the principle of focusing X ray optics to higher energies, up to 80 keV and beyond. To this end, ASI and CNES are presently studying the implementation of a X-ray mission called Simbol-X. Taking advantage of emerging technology in mirror manufacturing and spacecraft formation flying, Simbol-X will push grazing incidence imaging up to 80 keV and beyond, providing a strong improvement both in sensitivity and angular resolution compared to all instruments that have operated so far above 10 keV. This technological breakthrough will open a new highenergy window in astrophysics and cosmology. Here we will address the problematic of the development for such a distributed and deformable instrument. We will focus on the main performances of the telescope, like angular resolution, sensitivity and source localization. We will also describe the specificity of the calibration aspects of the payload distributed over two satellites and therefore in a not "frozen" configuration.

Monte Carlo Investigation of Phosphor Screens for X-ray Imaging

International Nuclear Information System (INIS)

Lim, Chang Hwy; Cheong, Min Ho; Cho, Min Kook; Shon, Choel Soon; Kim, Ho Kyung

2006-01-01

In order to detect X rays with pixel detectors, there are two technical methods; a direct detection using photoconductive material that permits the conversion of the incident X rays into the signal charges, and an indirect detection using scintillation material that converts the incident X rays into the optical photons. Therefore, two-dimensional (2D) photosensitive pixel array is necessary for the indirect-detection scheme. Terbium-doped gadolinium oxysulfide (Gd 2 O 2 S:Tb) phosphor screen is the most popular X-ray converter, and often employed to the digital radiographic system owing to its well-known technology and easy handling in size, thickness, and flexibility. Furthermore, the cost is effective. In cascaded imaging chains of the indirect-detection system, the phosphor screen is served as the first stage. Since the image signal-to-noise ratio (SNR) is irreversible through the cascaded system, the phosphor screen is largely responsible for the eventual image quality. For the various radiation qualities suggested by IEC (International Electrotechnical Commission, Report 1267), we have investigated important physical quantities of Gd 2 O 2 S:Tb screen with a wide range of coverages (34 . 135 mg/cm 2 ) by using Monte Carlo calculations. The results will be useful for the optimal design of digital X-ray imaging systems

Determinations of silicon and phosphorus in rice planted on a district of high incidence of amyotrophic lateral sclerosis by neutron activation and X-ray fluorescence analyses

Energy Technology Data Exchange (ETDEWEB)

Mizumoto, Yoshihiko; Ishikawa, Teruumi; Kusakabe, Toshio; Katsurayama, Kousuke (Kinki Univ., Higashi-Osaka, Osaka (Japan)); Iwata, Shiro

1989-12-01

Silicon and phosphorus contents in polished and unpolished rice planted on a district of high incidence of amyotrophic lateral sclerosis (ALS) have been determined by neutron activation and X-ray fluorescence methods, and compared with those from control areas. In the neutron activation analysis, {beta}-ray spectra of {sup 32}P produced by the {sup 31}P(n, {gamma}){sup 32}P reaction on polished and unpolished rice were measured with a low background {beta}-ray spectrometer. In the X-ray fluorescence analysis, characteristic X-ray were analyzed with a wavelength dispersive X-ray fluorescence spectrometer. Silicon contents in polished and unpolished rice from the ALS area are 42 {mu}g.g{sup -1} and 370 {mu}g.g{sup -1}, respectively, and the corresponding phosphorus contents are 1210 {mu}g.g{sup -1}, and 3370 {mu}g.g{sup -1}, respectively. The data for ALS area are equal to those for the control area within atandard deviation. (author).

Determinations of silicon and phosphorus in rice planted on a district of high incidence of amyotrophic lateral sclerosis by neutron activation and X-ray fluorescence analyses

International Nuclear Information System (INIS)

Mizumoto, Yoshihiko; Ishikawa, Teruumi; Kusakabe, Toshio; Katsurayama, Kousuke; Iwata, Shiro.

1989-01-01

Silicon and phosphorus contents in polished and unpolished rice planted on a district of high incidence of amyotrophic lateral sclerosis (ALS) have been determined by neutron activation and X-ray fluorescence methods, and compared with those from control areas. In the neutron activation analysis, β-ray spectra of 32 P produced by the 31 P(n, γ) 32 P reaction on polished and unpolished rice were measured with a low background β-ray spectrometer. In the X-ray fluorescence analysis, characteristic X-ray were analyzed with a wavelength dispersive X-ray fluorescence spectrometer. Silicon contents in polished and unpolished rice from the ALS area are 42 μg.g -1 and 370 μg.g -1 , respectively, and the corresponding phosphorus contents are 1210 μg.g -1 , and 3370 μg.g -1 , respectively. The data for ALS area are equal to those for the control area within atandard deviation. (author)

Escape probabilities for fluorescent x-rays

International Nuclear Information System (INIS)

Dance, D.R.; Day, G.J.

1985-01-01

Computation of the energy absorption efficiency of an x-ray photon detector involves consideration of the histories of the secondary particles produced in any initial or secondary interaction which may occur within the detector. In particular, the K or higher shell fluorescent x-rays which may be emitted following a photoelectric interaction can carry away a large fraction of the energy of the incident photon, especially if this energy is just above an absorption edge. The effects of such photons cannot be ignored and a correction term, depending upon the probability that the fluorescent x-rays will escape from the detector, must be applied to the energy absorption efficiency. For detectors such as x-ray intensifying screens, it has been usual to calculate this probability by numerical integration. In this note analytic expressions are derived for the escape probability of fluorescent photons from planar detectors in terms of exponential integral functions. Rational approximations for these functions are readily available and these analytic expressions therefore facilitate the computation of photon absorption efficiencies. A table is presented which should obviate the need for calculating the escape probability for most cases of interest. (author)

Flash X-ray

International Nuclear Information System (INIS)

Sato, Eiichi

2003-01-01

Generation of quasi-monochromatic X-ray by production of weakly ionized line plasma (flash X-ray), high-speed imaging by the X-ray and high-contrast imaging by the characteristic X-ray absorption are described. The equipment for the X-ray is consisted from the high-voltage power supply and condenser, turbo molecular pump, and plasma X-ray tube. The tube has a long linear anticathode to produce the line plasma and flash X-ray at 20 kA current at maximum. X-ray spectrum is measured by the imaging plate equipped in the computed radiography system after diffracted by a LiF single crystal bender. Cu anticathode generates sharp peaks of K X-ray series. The tissue images are presented for vertebra, rabbit ear and heart, and dog heart by X-ray fluoroscopy with Ce anticathode. Generation of K-orbit characteristic X-ray with extremely low bremsstrahung is to be attempted for medical use. (N.I.)