A versatile atomic force microscope for three-dimensional nanomanipulation and nanoassembly

International Nuclear Information System (INIS)

Xie Hui; Haliyo, Dogan Sinan; Regnier, Stephane

2009-01-01

A conventional atomic force microscope (AFM) has been successfully applied to manipulating nanoparticles (zero-dimensional), nanowires (one-dimensional) or nanotubes (one- or two-dimensional) by widely used pushing or pulling operations on a single surface. However, pick-and-place nanomanipulation in air is still a challenge. In this research, a modified AFM, called a three-dimensional (3D) manipulation force microscope (3DMFM), was developed to realize 3D nanomanipulation in air. This system consists of two individually actuated cantilevers with protruding tips that are facing each other, constructing a nanotweezer for the pick-and-place nanomanipulation. Before manipulation, one of the cantilevers is employed to position nano-objects and locate the tip of the other cantilever by image scanning. During the manipulation, these two cantilevers work collaboratively as a nanotweezer to grasp, transport and place the nano-objects with real-time force sensing. The manipulation capabilities of the nanotweezer were demonstrated by grabbing and manipulating silicon nanowires to build 3D nanowire crosses. 3D nanomanipulation and nanoassembly performed in air could become feasible through this newly developed 3DMFM.

System modelling of a lateral force microscope

International Nuclear Information System (INIS)

Michal, Guillaume; Lu, Cheng; Kiet Tieu, A

2008-01-01

To quantitatively analyse lateral force microscope measurements one needs to develop a model able to relate the photodiode signal to the force acting on the tip apex. In this paper we focus on the modelling of the interaction between the cantilever and the optical chain. The laser beam is discretized by a set of rays which propagates in the system. The analytical equation of a single ray's position on the optical sensor is presented as a function of the reflection's state on top of the cantilever. We use a finite element analysis on the cantilever to connect the optical model with the force acting on the tip apex. A first-order approximation of the constitutive equations are derived along with a definition of the system's crosstalk. Finally, the model is used to analytically simulate the 'wedge method' in the presence of crosstalk in 2D. The analysis shows how the torsion loop and torsion offset signals are affected by the crosstalk.

Design and performance of a high-resolution frictional force microscope with quantitative three-dimensional force sensitivity

International Nuclear Information System (INIS)

Dienwiebel, M.; Kuyper, E. de; Crama, L.; Frenken, J.W.M.; Heimberg, J.A.; Spaanderman, D.-J.; Glatra van Loon, D.; Zijlstra, T.; Drift, E. van der

2005-01-01

In this article, the construction and initial tests of a frictional force microscope are described. The instrument makes use of a microfabricated cantilever that allows one to independently measure the lateral forces in X and Y directions as well as the normal force. We use four fiber-optic interferometers to detect the motion of the sensor in three dimensions. The properties of our cantilevers allow easy and accurate normal and lateral force calibration, making it possible to measure the lateral force on a fully quantitative basis. First experiments on highly oriented pyrolytic graphite demonstrate that the microscope is capable of measuring lateral forces with a resolution down to 15 pN

Two-probe atomic-force microscope manipulator and its applications

Science.gov (United States)

Zhukov, A. A.; Stolyarov, V. S.; Kononenko, O. V.

2017-06-01

We report on a manipulator based on a two-probe atomic force microscope (AFM) with an individual feedback system for each probe. This manipulator works under an upright optical microscope with 3 mm focal distance. The design of the microscope helps us tomanipulate nanowires using the microscope probes as a two-prong fork. The AFM feedback is realized based on the dynamic full-time contact mode. The applications of the manipulator and advantages of its two-probe design are presented.

Two-probe atomic-force microscope manipulator and its applications.

Science.gov (United States)

Zhukov, A A; Stolyarov, V S; Kononenko, O V

2017-06-01

We report on a manipulator based on a two-probe atomic force microscope (AFM) with an individual feedback system for each probe. This manipulator works under an upright optical microscope with 3 mm focal distance. The design of the microscope helps us tomanipulate nanowires using the microscope probes as a two-prong fork. The AFM feedback is realized based on the dynamic full-time contact mode. The applications of the manipulator and advantages of its two-probe design are presented.

z calibration of the atomic force microscope by means of a pyramidal tip

DEFF Research Database (Denmark)

Jensen, Flemming

1993-01-01

A new method for imaging the probe tip of an atomic force microscope cantilever by the atomic force microscope itself (self-imaging) is presented. The self-imaging is accomplished by scanning the probe tip across a sharper tip on the surface. By using a pyramidal probe tip with a very well......-defined aspect ratio, this technique provides an excellent z-calibration standard for the atomic force microscope....

A Computer-Controlled Classroom Model of an Atomic Force Microscope

Science.gov (United States)

Engstrom, Tyler A.; Johnson, Matthew M.; Eklund, Peter C.; Russin, Timothy J.

2015-01-01

The concept of "seeing by feeling" as a way to circumvent limitations on sight is universal on the macroscopic scale--reading Braille, feeling one's way around a dark room, etc. The development of the atomic force microscope (AFM) in 1986 extended this concept to imaging in the nanoscale. While there are classroom demonstrations that use…

Optical forces, torques, and force densities calculated at a microscopic level using a self-consistent hydrodynamics method

Science.gov (United States)

Ding, Kun; Chan, C. T.

2018-04-01

The calculation of optical force density distribution inside a material is challenging at the nanoscale, where quantum and nonlocal effects emerge and macroscopic parameters such as permittivity become ill-defined. We demonstrate that the microscopic optical force density of nanoplasmonic systems can be defined and calculated using the microscopic fields generated using a self-consistent hydrodynamics model that includes quantum, nonlocal, and retardation effects. We demonstrate this technique by calculating the microscopic optical force density distributions and the optical binding force induced by external light on nanoplasmonic dimers. This approach works even in the limit when the nanoparticles are close enough to each other so that electron tunneling occurs, a regime in which classical electromagnetic approach fails completely. We discover that an uneven distribution of optical force density can lead to a light-induced spinning torque acting on individual particles. The hydrodynamics method offers us an accurate and efficient approach to study optomechanical behavior for plasmonic systems at the nanoscale.

Athermalization in atomic force microscope based force spectroscopy using matched microstructure coupling.

Science.gov (United States)

Torun, H; Finkler, O; Degertekin, F L

2009-07-01

The authors describe a method for athermalization in atomic force microscope (AFM) based force spectroscopy applications using microstructures that thermomechanically match the AFM probes. The method uses a setup where the AFM probe is coupled with the matched structure and the displacements of both structures are read out simultaneously. The matched structure displaces with the AFM probe as temperature changes, thus the force applied to the sample can be kept constant without the need for a separate feedback loop for thermal drift compensation, and the differential signal can be used to cancel the shift in zero-force level of the AFM.

Operation of a scanning near field optical microscope in reflection in combination with a scanning force microscope

NARCIS (Netherlands)

van Hulst, N.F.; Moers, M.H.P.; Moers, M.H.P.; Noordman, O.F.J.; Noordman, O.F.J.; Faulkner, T.; Segerink, Franciscus B.; van der Werf, Kees; de Grooth, B.G.; Bölger, B.; Bölger, B.

1992-01-01

Images obtained with a scanning near field optical microscope (SNOM) operating in reflection are presented. We have obtained the first results with a SiN tip as optical probe. The instrument is simultaneously operated as a scanning force microscope (SFM). Moreover, the instrument incorporates an

Optimization of Easy Atomic Force Microscope (ezAFM) Controls for Semiconductor Nanostructure Profiling

Science.gov (United States)

2017-09-01

ARL-MR-0965 ● SEP 2017 US Army Research Laboratory Optimization of Easy Atomic Force Microscope (ezAFM) Controls for... Optimization of Easy Atomic Force Microscope (ezAFM) Controls for Semiconductor Nanostructure Profiling by Satwik Bisoi Science and...REPORT TYPE Memorandum Report 3. DATES COVERED (From - To) 2017 July 05–2017 August 18 4. TITLE AND SUBTITLE Optimization of Easy Atomic Force

Cantilever-based optical interfacial force microscope in liquid using an optical-fiber tip

Directory of Open Access Journals (Sweden)

Byung I. Kim

2013-03-01

Full Text Available We developed a novel cantilever-based optical interfacial force microscope (COIFM to study molecular interaction in liquid environments. The force sensor was created by attaching a chemically etched optical-fiber tip to the force sensor with UV epoxy, and characterized by imaging on a calibration grid. The performance of the COIFM was then demonstrated by measuring the force between two oxidized silicon surfaces in 1 mM KCl as a function of distance. The result was consistent with previously reported electrical double layer forces, suggesting that a COIFM using an optical-fiber tip is capable of measuring force in a liquid environment.

Design of a scanning probe microscope with advanced sample treatment capabilities: An atomic force microscope combined with a miniaturized inductively coupled plasma source

International Nuclear Information System (INIS)

Hund, Markus; Herold, Hans

2007-01-01

We describe the design and performance of an atomic force microscope (AFM) combined with a miniaturized inductively coupled plasma source working at a radio frequency of 27.12 MHz. State-of-the-art scanning probe microscopes (SPMs) have limited in situ sample treatment capabilities. Aggressive treatments such as plasma etching or harsh treatments such as etching in aggressive liquids typically require the removal of the sample from the microscope. Consequently, time consuming procedures are required if the same sample spot has to be imaged after successive processing steps. We have developed a first prototype of a SPM which features a quasi in situ sample treatment using a modified commercial atomic force microscope. A sample holder is positioned in a special reactor chamber; the AFM tip can be retracted by several millimeters so that the chamber can be closed for a treatment procedure. Most importantly, after the treatment, the tip is moved back to the sample with a lateral drift per process step in the 20 nm regime. The performance of the prototype is characterized by consecutive plasma etching of a nanostructured polymer film

A variable-temperature nanostencil compatible with a low-temperature scanning tunneling microscope/atomic force microscope

International Nuclear Information System (INIS)

Steurer, Wolfram; Gross, Leo; Schlittler, Reto R.; Meyer, Gerhard

2014-01-01

We describe a nanostencil lithography tool capable of operating at variable temperatures down to 30 K. The setup is compatible with a combined low-temperature scanning tunneling microscope/atomic force microscope located within the same ultra-high-vacuum apparatus. The lateral movement capability of the mask allows the patterning of complex structures. To demonstrate operational functionality of the tool and estimate temperature drift and blurring, we fabricated LiF and NaCl nanostructures on Cu(111) at 77 K

A variable-temperature nanostencil compatible with a low-temperature scanning tunneling microscope/atomic force microscope

Energy Technology Data Exchange (ETDEWEB)

Steurer, Wolfram, E-mail: wst@zurich.ibm.com; Gross, Leo; Schlittler, Reto R.; Meyer, Gerhard [IBM Research-Zurich, 8803 Rüschlikon (Switzerland)

2014-02-15

We describe a nanostencil lithography tool capable of operating at variable temperatures down to 30 K. The setup is compatible with a combined low-temperature scanning tunneling microscope/atomic force microscope located within the same ultra-high-vacuum apparatus. The lateral movement capability of the mask allows the patterning of complex structures. To demonstrate operational functionality of the tool and estimate temperature drift and blurring, we fabricated LiF and NaCl nanostructures on Cu(111) at 77 K.

A variable-temperature nanostencil compatible with a low-temperature scanning tunneling microscope/atomic force microscope.

Science.gov (United States)

Steurer, Wolfram; Gross, Leo; Schlittler, Reto R; Meyer, Gerhard

2014-02-01

We describe a nanostencil lithography tool capable of operating at variable temperatures down to 30 K. The setup is compatible with a combined low-temperature scanning tunneling microscope/atomic force microscope located within the same ultra-high-vacuum apparatus. The lateral movement capability of the mask allows the patterning of complex structures. To demonstrate operational functionality of the tool and estimate temperature drift and blurring, we fabricated LiF and NaCl nanostructures on Cu(111) at 77 K.

A Cost-Effective Atomic Force Microscope for Undergraduate Control Laboratories

Science.gov (United States)

Jones, C. N.; Goncalves, J.

2010-01-01

This paper presents a simple, cost-effective and robust atomic force microscope (AFM), which has been purposely designed and built for use as a teaching aid in undergraduate controls labs. The guiding design principle is to have all components be open and visible to the students, so the inner functioning of the microscope has been made clear to…

Large Scale Scanning Probe Microscope "Making Shear Force Scanning visible."

NARCIS (Netherlands)

Bosma, E.; Offerhaus, Herman L.; van der Veen, Jan T.; van der Veen, J.T.; Segerink, Franciscus B.; Wessel, I.M.

2010-01-01

We describe a demonstration of a scanning probe microscope with shear-force tuning fork feedback. The tuning fork is several centimeters long, and the rigid fiber is replaced by a toothpick. By scaling this demonstration to visible dimensions the accessibility of shear-force scanning and tuning fork

Atomic force microscope characterization of a resonating nanocantilever

DEFF Research Database (Denmark)

Abadal, G.; Davis, Zachary James; Borrise, X.

2003-01-01

An atomic force microscope (AFM) is used as a nanometer-scale resolution tool for the characterization of the electromechanical behaviour of a resonant cantilever-based mass sensor. The cantilever is actuated electrostatically by applying DC and AC voltages from a driver electrode placed closely...

Method for lateral force calibration in atomic force microscope using MEMS microforce sensor.

Science.gov (United States)

Dziekoński, Cezary; Dera, Wojciech; Jarząbek, Dariusz M

2017-11-01

In this paper we present a simple and direct method for the lateral force calibration constant determination. Our procedure does not require any knowledge about material or geometrical parameters of an investigated cantilever. We apply a commercially available microforce sensor with advanced electronics for direct measurement of the friction force applied by the cantilever's tip to a flat surface of the microforce sensor measuring beam. Due to the third law of dynamics, the friction force of the equal value tilts the AFM cantilever. Therefore, torsional (lateral force) signal is compared with the signal from the microforce sensor and the lateral force calibration constant is determined. The method is easy to perform and could be widely used for the lateral force calibration constant determination in many types of atomic force microscopes. Copyright © 2017 Elsevier B.V. All rights reserved.

MIDAS: Lessons learned from the first spaceborne atomic force microscope

Science.gov (United States)

Bentley, Mark Stephen; Arends, Herman; Butler, Bart; Gavira, Jose; Jeszenszky, Harald; Mannel, Thurid; Romstedt, Jens; Schmied, Roland; Torkar, Klaus

2016-08-01

The Micro-Imaging Dust Analysis System (MIDAS) atomic force microscope (AFM) onboard the Rosetta orbiter was the first such instrument launched into space in 2004. Designed only a few years after the technique was invented, MIDAS is currently orbiting comet 67P Churyumov-Gerasimenko and producing the highest resolution 3D images of cometary dust ever made in situ. After more than a year of continuous operation much experience has been gained with this novel instrument. Coupled with operations of the Flight Spare and advances in terrestrial AFM a set of "lessons learned" has been produced, cumulating in recommendations for future spaceborne atomic force microscopes. The majority of the design could be reused as-is, or with incremental upgrades to include more modern components (e.g. the processor). Key additional recommendations are to incorporate an optical microscope to aid the search for particles and image registration, to include a variety of cantilevers (with different spring constants) and a variety of tip geometries.

High-speed force mapping on living cells with a small cantilever atomic force microscope

International Nuclear Information System (INIS)

Braunsmann, Christoph; Seifert, Jan; Rheinlaender, Johannes; Schäffer, Tilman E.

2014-01-01

The imaging speed of the wide-spread force mapping mode for quantitative mechanical measurements on soft samples in liquid with the atomic force microscope (AFM) is limited by the bandwidth of the z-scanner and viscous drag forces on the cantilever. Here, we applied high-speed, large scan-range atomic force microscopy and small cantilevers to increase the speed of force mapping by ≈10−100 times. This allowed resolving dynamic processes on living mouse embryonic fibroblasts. Cytoskeleton reorganization during cell locomotion, growth of individual cytoskeleton fibers, cell blebbing, and the formation of endocytic pits in the cell membrane were observed. Increasing the force curve rate from 2 to 300 Hz increased the measured apparent Young's modulus of the cells by about 10 times, which facilitated force mapping measurements at high speed

High-speed force mapping on living cells with a small cantilever atomic force microscope

Energy Technology Data Exchange (ETDEWEB)

Braunsmann, Christoph; Seifert, Jan; Rheinlaender, Johannes; Schäffer, Tilman E., E-mail: Tilman.Schaeffer@uni-tuebingen [Institute of Applied Physics and LISA, University of Tübingen, Auf der Morgenstelle 10, 72076 Tübingen (Germany)

2014-07-15

The imaging speed of the wide-spread force mapping mode for quantitative mechanical measurements on soft samples in liquid with the atomic force microscope (AFM) is limited by the bandwidth of the z-scanner and viscous drag forces on the cantilever. Here, we applied high-speed, large scan-range atomic force microscopy and small cantilevers to increase the speed of force mapping by ≈10−100 times. This allowed resolving dynamic processes on living mouse embryonic fibroblasts. Cytoskeleton reorganization during cell locomotion, growth of individual cytoskeleton fibers, cell blebbing, and the formation of endocytic pits in the cell membrane were observed. Increasing the force curve rate from 2 to 300 Hz increased the measured apparent Young's modulus of the cells by about 10 times, which facilitated force mapping measurements at high speed.

A hybrid scanning force and light microscope for surface imaging and three-dimensional optical sectioning in differential interference contrast.

Science.gov (United States)

Stemmer, A

1995-04-01

The design of a scanned-cantilever-type force microscope is presented which is fully integrated into an inverted high-resolution video-enhanced light microscope. This set-up allows us to acquire thin optical sections in differential interference contrast (DIC) or polarization while the force microscope is in place. Such a hybrid microscope provides a unique platform to study how cell surface properties determine, or are affected by, the three-dimensional dynamic organization inside the living cell. The hybrid microscope presented in this paper has proven reliable and versatile for biological applications. It is the only instrument that can image a specimen by force microscopy and high-power DIC without having either to translate the specimen or to remove the force microscope. Adaptation of the design features could greatly enhance the suitability of other force microscopes for biological work.

Characterizing absolute piezoelectric microelectromechanical system displacement using an atomic force microscope

International Nuclear Information System (INIS)

Evans, J.; Chapman, S.

2014-01-01

Piezoresponse Force Microscopy (PFM) is a popular tool for the study of ferroelectric and piezoelectric materials at the nanometer level. Progress in the development of piezoelectric MEMS fabrication is highlighting the need to characterize absolute displacement at the nanometer and Ångstrom scales, something Atomic Force Microscopy (AFM) might do but PFM cannot. Absolute displacement is measured by executing a polarization measurement of the ferroelectric or piezoelectric capacitor in question while monitoring the absolute vertical position of the sample surface with a stationary AFM cantilever. Two issues dominate the execution and precision of such a measurement: (1) the small amplitude of the electrical signal from the AFM at the Ångstrom level and (2) calibration of the AFM. The authors have developed a calibration routine and test technique for mitigating the two issues, making it possible to use an atomic force microscope to measure both the movement of a capacitor surface as well as the motion of a micro-machine structure actuated by that capacitor. The theory, procedures, pitfalls, and results of using an AFM for absolute piezoelectric measurement are provided

Characterizing absolute piezoelectric microelectromechanical system displacement using an atomic force microscope

Energy Technology Data Exchange (ETDEWEB)

Evans, J., E-mail: radiant@ferrodevices.com; Chapman, S., E-mail: radiant@ferrodevices.com [Radiant Technologies, Inc., 2835C Pan American Fwy NE, Albuquerque, New Mexico 87107 (United States)

2014-08-14

Piezoresponse Force Microscopy (PFM) is a popular tool for the study of ferroelectric and piezoelectric materials at the nanometer level. Progress in the development of piezoelectric MEMS fabrication is highlighting the need to characterize absolute displacement at the nanometer and Ångstrom scales, something Atomic Force Microscopy (AFM) might do but PFM cannot. Absolute displacement is measured by executing a polarization measurement of the ferroelectric or piezoelectric capacitor in question while monitoring the absolute vertical position of the sample surface with a stationary AFM cantilever. Two issues dominate the execution and precision of such a measurement: (1) the small amplitude of the electrical signal from the AFM at the Ångstrom level and (2) calibration of the AFM. The authors have developed a calibration routine and test technique for mitigating the two issues, making it possible to use an atomic force microscope to measure both the movement of a capacitor surface as well as the motion of a micro-machine structure actuated by that capacitor. The theory, procedures, pitfalls, and results of using an AFM for absolute piezoelectric measurement are provided.

An atomic force microscope nanoscalpel for nanolithography and biological applications

Energy Technology Data Exchange (ETDEWEB)

Beard, J D; Burbridge, D J; Moskalenko, A V; Dudko, O; Gordeev, S N [Department of Physics, University of Bath, Bath BA2 7AY (United Kingdom); Yarova, P L; Smirnov, S V, E-mail: jdb28@bath.ac.u [Department of Pharmacy and Pharmacology, University of Bath, Bath BA2 7AY (United Kingdom)

2009-11-04

We present the fabrication of specialized nanotools, termed nanoscalpels, and their application for nanolithography and nanomechanical manipulation of biological objects. Fabricated nanoscalpels have the shape of a thin blade with the controlled thickness of 20-30 nm and width of 100-200 nm. They were fabricated using electron beam induced deposition at the apex of atomic force microscope probes and are hard enough for a single cut to penetrate a {approx}45 nm thick gold layer; and thus can be used for making narrow electrode gaps required for fabrication of nanoelectronic devices. As an atomic force microscope-based technique the nanoscalpel provides simultaneous control of the applied cutting force and the depth of the cut. Using mammalian cells as an example, we demonstrated their ability to make narrow incisions and measurements of local elastic and inelastic characteristics of a cell, making nanoscalpels also useful as a nanosurgical tool in cell biology. Therefore, we believe that the nanoscalpel could serve as an important tool for nanofabrication and nanosurgery on biological objects.

Capillary force on a tilted cylinder: Atomic Force Microscope (AFM) measurements.

Science.gov (United States)

Kosgodagan Acharige, Sébastien; Laurent, Justine; Steinberger, Audrey

2017-11-01

The capillary force in situations where the liquid meniscus is asymmetric, such as the one around a tilted object, has been hitherto barely investigated even though these situations are very common in practice. In particular, the capillary force exerted on a tilted object may depend on the dipping angle i. We investigate experimentally the capillary force that applies on a tilted cylinder as a function of its dipping angle i, using a home-built tilting Atomic Force Microscope (AFM) with custom made probes. A micrometric-size rod is glued at the end of an AFM cantilever of known stiffness, whose deflection is measured when the cylindrical probe is dipped in and retracted from reference liquids. We show that a torque correction is necessary to understand the measured deflection. We give the explicit expression of this correction as a function of the probes' geometrical parameters, so that its magnitude can be readily evaluated. The results are compatible with a vertical capillary force varying as 1/cosi, in agreement with a recent theoretical prediction. Finally, we discuss the accuracy of the method for measuring the surface tension times the cosine of the contact angle of the liquid on the probe. Copyright © 2017 Elsevier Inc. All rights reserved.

Low temperature behavior of magnetic domains observed using a magnetic force microscope

International Nuclear Information System (INIS)

Chung, S. H.; Shinde, S. R.; Ogale, S. B.; Venkatesan, T.; Greene, R. L.; Dreyer, M.; Gomez, R. D.

2001-01-01

A commercial atomic force microscope/magnetic force microscope (MFM) was modified to cool magnetic samples down to around 100 K under a high vacuum while maintaining its routine imaging functionality. MFM images of a 120 nm thick La 0.7 Ca 0.3 MnO 3 film on a LaAlO 3 substrate at low temperature show the paramagnetic-to-ferromagnetic phase transition. Evolution of magnetic domains and magnetic ripples with decreasing temperature are also observed near the edge of a 20 nm thick patterned Co film on a Si substrate. [copyright] 2001 American Institute of Physics

Cantilever contribution to the total electrostatic force measured with the atomic force microscope

International Nuclear Information System (INIS)

Guriyanova, Svetlana; Golovko, Dmytro S; Bonaccurso, Elmar

2010-01-01

The atomic force microscope (AFM) is a powerful tool for surface imaging at the nanometer scale and surface force measurements in the piconewton range. Among long-range surface forces, the electrostatic forces play a predominant role. They originate if the electric potentials of the substrate and of the tip of the AFM cantilever are different. A quantitative interpretation of the AFM signal is often difficult because it depends in a complicated fashion on the cantilever–tip–surface geometry. Since the electrostatic interaction is a long-range interaction, the cantilever, which is many microns from the surface, contributes to the total electrostatic force along with the tip. Here we present results of the electrostatic interaction between a conducting flat surface and horizontal or tilted cantilevers, with and without tips, at various distances from the surface. As addressed in a previous work, we show that the contribution of the cantilever to the overall force cannot be neglected. Based on a predictive model and on 3D confocal measurements, we discuss the influence of the tilting angle of the cantilever

Midinfrared absorption measured at a lambda/400 resolution with an atomic force microscope.

Science.gov (United States)

Houel, Julien; Homeyer, Estelle; Sauvage, Sébastien; Boucaud, Philippe; Dazzi, Alexandre; Prazeres, Rui; Ortéga, Jean-Michel

2009-06-22

Midinfrared absorption can be locally measured using a detection combining an atomic force microscope and a pulsed excitation. This is illustrated for the midinfrared bulk GaAs phonon absorption and for the midinfrared absorption of thin SiO(2) microdisks. We show that the signal given by the cantilever oscillation amplitude of the atomic force microscope follows the spectral dependence of the bulk material absorption. The absorption spatial resolution achieved with microdisks is around 50 nanometer for an optical excitation around 22 micrometer wavelength.

A combined optical and atomic force microscope for live cell investigations

International Nuclear Information System (INIS)

Madl, Josef; Rhode, Sebastian; Stangl, Herbert; Stockinger, Hannes; Hinterdorfer, Peter; Schuetz, Gerhard J.; Kada, Gerald

2006-01-01

We present an easy-to-use combination of an atomic force microscope (AFM) and an epi-fluorescence microscope, which allows live cell imaging under physiological conditions. High-resolution AFM images were acquired while simultaneously monitoring either the fluorescence image of labeled membrane components, or a high-contrast optical image (DIC, differential interference contrast). By applying two complementary techniques at the same time, additional information and correlations between structure and function of living organisms were obtained. The synergy effects between fluorescence imaging and AFM were further demonstrated by probing fluorescence-labeled receptor clusters in the cell membrane via force spectroscopy using antibody-functionalized tips. The binding probability on receptor-containing areas identified with fluorescence microscopy ('receptor-positive sites') was significantly higher than that on sites lacking receptors

Scratch direction and threshold force in nanoscale scratching using atomic force microscopes

Energy Technology Data Exchange (ETDEWEB)

Tseng, Ampere A., E-mail: ampere.tseng@asu.edu [Department of Materials Science and Engineering, National Taiwan University of Science and Technology, Taipei 106, Taiwan (China); Kuo, Chung-Feng Jeffrey; Jou, Shyankay [Department of Materials Science and Engineering, National Taiwan University of Science and Technology, Taipei 106, Taiwan (China); Nishimura, Shinya; Shirakashi, Jun-ichi [Department of Electrical and Electronic Engineering, Tokyo University of Agriculture and Technology, Tokyo 184-8588 (Japan)

2011-09-01

The nanoscaled tip in an AFM (atomic force microscope) has become an effective scratching tool for material removing in nanofabrication. In this article, the characteristics of using a diamond-coated pyramidal tip to scratch Ni-Fe thin film surfaces was experimentally investigated with the focus on the evaluation of the influence of the scratch or scan direction on the final shape of the scratched geometry as well as the applied scratch force. Results indicated that both the scratched profile and the scratch force were greatly affected by the scratch direction. It has been found that, to minimize the formation of protuberances along the groove sides and to have a better control of the scratched geometry, the tip face should be perpendicular to the scratching direction, which is also known as orthogonal cutting condition. To demonstrate the present findings, three groove patterns have been scratched with the tip face perpendicular to the scratching direction and very little amount of protuberances was observed. The threshold scratch force was also predicted based on the Hertz contact theory. Without considering the surface friction and adhesive forces between the tip and substrate, the threshold force predicted was twice smaller than the measurement value. Finally, recommendations for technical improvement and research focuses are provided.

Scratch direction and threshold force in nanoscale scratching using atomic force microscopes

International Nuclear Information System (INIS)

Tseng, Ampere A.; Kuo, Chung-Feng Jeffrey; Jou, Shyankay; Nishimura, Shinya; Shirakashi, Jun-ichi

2011-01-01

The nanoscaled tip in an AFM (atomic force microscope) has become an effective scratching tool for material removing in nanofabrication. In this article, the characteristics of using a diamond-coated pyramidal tip to scratch Ni-Fe thin film surfaces was experimentally investigated with the focus on the evaluation of the influence of the scratch or scan direction on the final shape of the scratched geometry as well as the applied scratch force. Results indicated that both the scratched profile and the scratch force were greatly affected by the scratch direction. It has been found that, to minimize the formation of protuberances along the groove sides and to have a better control of the scratched geometry, the tip face should be perpendicular to the scratching direction, which is also known as orthogonal cutting condition. To demonstrate the present findings, three groove patterns have been scratched with the tip face perpendicular to the scratching direction and very little amount of protuberances was observed. The threshold scratch force was also predicted based on the Hertz contact theory. Without considering the surface friction and adhesive forces between the tip and substrate, the threshold force predicted was twice smaller than the measurement value. Finally, recommendations for technical improvement and research focuses are provided.

Mechanochemistry Induced Using Force Exerted by a Functionalized Microscope Tip

DEFF Research Database (Denmark)

Zhang, Yajie; Wang, Yongfeng; Lü, Jing-Tao

2017-01-01

Atomic-scale mechanochemistry is realized from force exerted by a C60 -functionalized scanning tunneling microscope tip. Two conformers of tin phthalocyanine can be prepared on coinage-metal surfaces. A transition between these conformers is induced on Cu(111) and Ag(100). Density...

Atomic force microscopic imaging of Acanthamoeba castellanii and Balamuthia mandrillaris trophozoites and cysts.

Science.gov (United States)

Aqeel, Yousuf; Siddiqui, Ruqaiyyah; Ateeq, Muhammad; Raza Shah, Muhammad; Kulsoom, Huma; Khan, Naveed Ahmed

2015-01-01

Light microscopy and electron microscopy have been successfully used in the study of microbes, as well as free-living protists. Unlike light microscopy, which enables us to observe living organisms or the electron microscope which provides a two-dimensional image, atomic force microscopy provides a three-dimensional surface profile. Here, we observed two free-living amoebae, Acanthamoeba castellanii and Balamuthia mandrillaris under the phase contrast inverted microscope, transmission electron microscope and atomic force microscope. Although light microscopy was of lower magnification, it revealed functional biology of live amoebae such as motility and osmoregulation using contractile vacuoles of the trophozoite stage, but it is of limited value in defining the cyst stage. In contrast, transmission electron microscopy showed significantly greater magnification and resolution to reveal the ultra-structural features of trophozoites and cysts including intracellular organelles and cyst wall characteristics but it only produced a snapshot in time of a dead amoeba cell. Atomic force microscopy produced three-dimensional images providing detailed topographic description of shape and surface, phase imaging measuring boundary stiffness, and amplitude measurements including width, height and length of A. castellanii and B. mandrillaris trophozoites and cysts. These results demonstrate the importance of the application of various microscopic methods in the biological and structural characterization of the whole cell, ultra-structural features, as well as surface components and cytoskeleton of protist pathogens. © 2014 The Author(s) Journal of Eukaryotic Microbiology © 2014 International Society of Protistologists.

On some recent developments in microscopic nuclear models

International Nuclear Information System (INIS)

Piepenbring, R.

1987-01-01

An overview of the status of development of some microscopic nuclear models is presented. A special attention is paid to the recent calculations starting from the effective nucleon-nucleon force, to the angular momentum projection method before variation, to the multiphonon method and to the selfconsistent coordinate method. The success and the limitations of the three last mentioned models are illustrated in the example of 168 Er

A subsurface add-on for standard atomic force microscopes

Energy Technology Data Exchange (ETDEWEB)

Verbiest, G. J., E-mail: Verbiest@physik.rwth-aachen.de [JARA-FIT and II. Institute of Physics, RWTH Aachen University, 52074 Aachen (Germany); Zalm, D. J. van der; Oosterkamp, T. H.; Rost, M. J., E-mail: Rost@physics.leidenuniv.nl [Kamerlingh Onnes Laboratory, Leiden University, P.O. Box 9504, 2300 RA Leiden (Netherlands)

2015-03-15

The application of ultrasound in an Atomic Force Microscope (AFM) gives access to subsurface information. However, no commercially AFM exists that is equipped with this technique. The main problems are the electronic crosstalk in the AFM setup and the insufficiently strong excitation of the cantilever at ultrasonic (MHz) frequencies. In this paper, we describe the development of an add-on that provides a solution to these problems by using a special piezo element with a lowest resonance frequency of 2.5 MHz and by separating the electronic connection for this high frequency piezo element from all other connections. In this sense, we support researches with the possibility to perform subsurface measurements with their existing AFMs and hopefully pave also the way for the development of a commercial AFM that is capable of imaging subsurface features with nanometer resolution.

MIDAS - an atomic force microscope for in-situ imaging of cometary dust particles

International Nuclear Information System (INIS)

Fehringer, H.M.; Ruedenauer, F.G.; Steiger, W.

1997-02-01

Comets are interesting bodies, since they are considered to consist of matter remaining in essentially unchanged chemistry from the presolar nebula. Investigation of cometary matter therefore permits to draw conclusion s with respect to the composition of presolar matter. The atomic force microscope MIDAS will be the first instrument to analyze, within ESA's ROSETTA-mission priestine cometary matter in the form of dust particles emitted by comet WIRTANEN during its perihelion in 2013. Within this project, a dust model has been developed, permitting estimation of dust collection times required for statistically significant imaging of cometary particles. The dynamics of dust collection has been developed and experimental dust collection surfaces have been produced making use of modem nanostructuring techniques. Mechanical properties of 3-dimensional piezo-control elements, which are an essential part of the MIDAS microscope, have been determined. (author)

A combined optical and atomic force microscope for live cell investigations

Energy Technology Data Exchange (ETDEWEB)

Madl, Josef [Institute for Biophysics, Johannes Kepler University Linz, Altenbergerstr. 69, 4040 Linz (Austria); Rhode, Sebastian [Institute for Biophysics, Johannes Kepler University Linz, Altenbergerstr. 69, 4040 Linz (Austria); Stangl, Herbert [Institute for Medical Chemistry, Medical University Vienna, Waehringerstr. 10, 1090 Vienna (Austria); Stockinger, Hannes [Department of Molecular Immunology, Center for Biomolecular Medicine and Pharmacology, Medical University Vienna, Lazarettgasse 19, 1090 Vienna (Austria); Hinterdorfer, Peter [Institute for Biophysics, Johannes Kepler University Linz, Altenbergerstr. 69, 4040 Linz (Austria); Schuetz, Gerhard J. [Institute for Biophysics, Johannes Kepler University Linz, Altenbergerstr. 69, 4040 Linz (Austria); Kada, Gerald [Scientec, Mitterbauerweg 4, 4020 Linz (Austria)]. E-mail: gerald_kada@agilent.com

2006-06-15

We present an easy-to-use combination of an atomic force microscope (AFM) and an epi-fluorescence microscope, which allows live cell imaging under physiological conditions. High-resolution AFM images were acquired while simultaneously monitoring either the fluorescence image of labeled membrane components, or a high-contrast optical image (DIC, differential interference contrast). By applying two complementary techniques at the same time, additional information and correlations between structure and function of living organisms were obtained. The synergy effects between fluorescence imaging and AFM were further demonstrated by probing fluorescence-labeled receptor clusters in the cell membrane via force spectroscopy using antibody-functionalized tips. The binding probability on receptor-containing areas identified with fluorescence microscopy ('receptor-positive sites') was significantly higher than that on sites lacking receptors.

„New approaches to atomic force microscope lithography on silicon"

DEFF Research Database (Denmark)

Birkelund, Karen; Thomsen, Erik Vilain; Rasmussen, Jan Pihl

1997-01-01

We have investigated new approaches to the formation of conducting nanowires on crystalline silicon surfaces using atomic force microscope (AFM) lithography. To increase processing speed and reduce wear of the AFM tip, large-scale structures are formed with a direct laser write setup, while the AFM...

Manipulation and soldering of carbon nanotubes using atomic force microscope

International Nuclear Information System (INIS)

Kashiwase, Yuta; Ikeda, Takayuki; Oya, Takahide; Ogino, Toshio

2008-01-01

Manipulation of carbon nanotubes (CNTs) by an atomic force microscope (AFM) and soldering of CNTs using Fe oxide nanoparticles are described. We succeeded to separate a CNT bundle into two CNTs or CNT bundles, to move the separated CNT to a desirable position, and to bind it to another bundle. For the accurate manipulation, load of the AFM cantilever and frequency of the scan were carefully selected. We soldered two CNTs using an Fe oxide nanoparticle prepared from a ferritin molecule. The adhesion forces between the soldered CNTs were examined by an AFM and it was found that the CNTs were bound, though the binding force was not strong

Uncertainty quantification in nanomechanical measurements using the atomic force microscope

Science.gov (United States)

Ryan Wagner; Robert Moon; Jon Pratt; Gordon Shaw; Arvind Raman

2011-01-01

Quantifying uncertainty in measured properties of nanomaterials is a prerequisite for the manufacture of reliable nanoengineered materials and products. Yet, rigorous uncertainty quantification (UQ) is rarely applied for material property measurements with the atomic force microscope (AFM), a widely used instrument that can measure properties at nanometer scale...

A compact CCD-monitored atomic force microscope with optical vision and improved performances.

Science.gov (United States)

Mingyue, Liu; Haijun, Zhang; Dongxian, Zhang

2013-09-01

A novel CCD-monitored atomic force microscope (AFM) with optical vision and improved performances has been developed. Compact optical paths are specifically devised for both tip-sample microscopic monitoring and cantilever's deflection detecting with minimized volume and optimal light-amplifying ratio. The ingeniously designed AFM probe with such optical paths enables quick and safe tip-sample approaching, convenient and effective tip-sample positioning, and high quality image scanning. An image stitching method is also developed to build a wider-range AFM image under monitoring. Experiments show that this AFM system can offer real-time optical vision for tip-sample monitoring with wide visual field and/or high lateral optical resolution by simply switching the objective; meanwhile, it has the elegant performances of nanometer resolution, high stability, and high scan speed. Furthermore, it is capable of conducting wider-range image measurement while keeping nanometer resolution. Copyright © 2013 Wiley Periodicals, Inc.

Probing Field Distributions on Waveguide Structures with an Atomic Force/Photon Scanning Tunneling Microscope

NARCIS (Netherlands)

Borgonjen, E.G.; Borgonjen, E.G.; Moers, M.H.P.; Moers, M.H.P.; Ruiter, A.G.T.; van Hulst, N.F.

1995-01-01

A 'stand-alone' Photon Scanning Tunneling Microscope combined with an Atomic force Microscope, using a micro-fabricated silicon-nitride probe, is applied to the imaging of field distribution in integrated optical ridge waveguides. The electric field on the waveguide is locally probed by coupling to

Local detection of X-ray spectroscopies with an in-situ Atomic Force Microscope

International Nuclear Information System (INIS)

Rodrigues, M S; Dhez, O; Denmat, S Le; Felici, R; Comin, F; Chevrier, J

2008-01-01

The in situ combination of Scanning Probe Microscopies with X-ray microbeams adds a variety of new possibilities to the panoply of synchrotron radiation techniques. This paper describes an optics-free Atomic Force Microscope that can be directly installed on most of the synchrotron radiation end-stations for combined X-ray and atomic force microscopy experiments. The instrument can be used for atomic force imaging of the investigated sample or to locally measure the X-ray absorption or diffraction, or it can also be used to mechanically interact with the sample while simultaneously taking spectroscopy or diffraction measurements. The local character of these measurements is intrinsically linked with the use of the Atomic Force Microscope tip. It is the sharp tip that gives the opportunity to measure the photons flux impinging on it, or to locally measure the absorption coefficient or the shape of the diffraction pattern. At the end an estimation of the limits of the various techniques presented is also discussed.

Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope

International Nuclear Information System (INIS)

Hagedorn, Till; Ouali, Mehdi El; Paul, William; Oliver, David; Miyahara, Yoichi; Gruetter, Peter

2011-01-01

A modification of the common electrochemical etching setup is presented. The described method reproducibly yields sharp tungsten tips for usage in the scanning tunneling microscope and tuning fork atomic force microscope. In situ treatment under ultrahigh vacuum (p ≤10 -10 mbar) conditions for cleaning and fine sharpening with minimal blunting is described. The structure of the microscopic apex of these tips is atomically resolved with field ion microscopy and cross checked with field emission.

Measuring microscopic forces and torques using optical tweezers

CSIR Research Space (South Africa)

Mc

2009-07-01

Full Text Available stream_source_info McLaren_2009.pdf.txt stream_content_type text/plain stream_size 2976 Content-Encoding UTF-8 stream_name McLaren_2009.pdf.txt Content-Type text/plain; charset=UTF-8 Measuring microscopic forces... and torques using optical tweezers M.G. McLaren1,2, A. Forbes2,3,4 and E. Sideras-Haddad2 1 CSIR National Laser Centre 2 School of Physics, University of Witwatersrand 3 School of Physics, University of KwaZulu-Natal 4 School of Physics, University...

A new ion sensing deep atomic force microscope

Energy Technology Data Exchange (ETDEWEB)

Drake, Barney; Randall, Connor; Bridges, Daniel; Hansma, Paul K. [Department of Physics, University of California, Santa Barbara, California 93106 (United States)

2014-08-15

Here we describe a new deep atomic force microscope (AFM) capable of ion sensing. A novel probe assembly incorporates a micropipette that can be used both for sensing ion currents and as the tip for AFM imaging. The key advance of this instrument over previous ion sensing AFMs is that it uses conventional micropipettes in a novel suspension system. This paper focuses on sensing the ion current passively while using force feedback for the operation of the AFM in contact mode. Two images are obtained simultaneously: (1) an AFM topography image and (2) an ion current image. As an example, two images of a MEMS device with a microchannel show peaks in the ion current as the pipette tip goes over the edges of the channel. This ion sensing AFM can also be used in other modes including tapping mode with force feedback as well as in non-contact mode by utilizing the ion current for feedback, as in scanning ion conductance microscopy. The instrument is gentle enough to be used on some biological samples such as plant leaves.

Theoretical study of the effect of probe shape on adhesion force between probe and substrate in atomic force microscope experiment

OpenAIRE

Yang, Li; Hu, Junhui; Kong, Lingjiang

2017-01-01

The quantitative description of adhesion force dependence on the probe shapes are of importance in many scientific and industrial fields. In order to elucidate how the adhesion force varied with the probe shape in atomic force microscope manipulation experiment, we performed a theoretical study of the influences of the probe shape (the sphere and parabolic probe) on the adhesion force at different humidity. We found that the combined action of the triple point and the Kelvin radius guiding th...

Atomic force microscopic study of the influence of physical stresses on Saccharomyces cerevisiae and Schizosaccharomyces pombe.

Science.gov (United States)

Adya, Ashok K; Canetta, Elisabetta; Walker, Graeme M

2006-01-01

Morphological changes in the cell surfaces of the budding yeast Saccharomyces cerevisiae (strain NCYC 1681), and the fission yeast Schizosaccharomyces pombe (strain DVPB 1354), in response to thermal and osmotic stresses, were investigated using an atomic force microscope. With this microscope imaging, together with measurements of culture viability and cell size, it was possible to relate topological changes of the cell surface at nanoscale with cellular stress physiology. As expected, when the yeasts were exposed to thermostress or osmostress, their viability together with the mean cell volume decreased in conjunction with the increase in thermal or osmotic shock. Nevertheless, the viability of cells stressed for up to 1 h remained relatively high. For example, viabilities were >50% and >90% for the thermostressed, and >60% and >70% for the osmostressed S. cerevisiae and Schiz. pombe, respectively. Mean cell volume measurements, and bearing and roughness analyses of atomic force microscope images of stressed yeasts indicate that Schiz. pombe may be more resistant to physical stresses than S. cerevisiae. Overall, this study has highlighted the usefulness of atomic force microscope in studies of yeast stress physiology.

Influence of the atomic force microscope tip on the multifractal analysis of rough surfaces

International Nuclear Information System (INIS)

Klapetek, Petr; Ohlidal, Ivan; Bilek, Jindrich

2004-01-01

In this paper, the influence of atomic force microscope tip on the multifractal analysis of rough surfaces is discussed. This analysis is based on two methods, i.e. on the correlation function method and the wavelet transform modulus maxima method. The principles of both methods are briefly described. Both methods are applied to simulated rough surfaces (simulation is performed by the spectral synthesis method). It is shown that the finite dimensions of the microscope tip misrepresent the values of the quantities expressing the multifractal analysis of rough surfaces within both the methods. Thus, it was concretely shown that the influence of the finite dimensions of the microscope tip changed mono-fractal properties of simulated rough surface to multifractal ones. Further, it is shown that a surface reconstruction method developed for removing the negative influence of the microscope tip does not improve the results obtained in a substantial way. The theoretical procedures concerning both the methods, i.e. the correlation function method and the wavelet transform modulus maxima method, are illustrated for the multifractal analysis of randomly rough gallium arsenide surfaces prepared by means of the thermal oxidation of smooth gallium arsenide surfaces and subsequent dissolution of the oxide films

Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope.

Science.gov (United States)

Hagedorn, Till; El Ouali, Mehdi; Paul, William; Oliver, David; Miyahara, Yoichi; Grütter, Peter

2011-11-01

A modification of the common electrochemical etching setup is presented. The described method reproducibly yields sharp tungsten tips for usage in the scanning tunneling microscope and tuning fork atomic force microscope. In situ treatment under ultrahigh vacuum (p ≤10(-10) mbar) conditions for cleaning and fine sharpening with minimal blunting is described. The structure of the microscopic apex of these tips is atomically resolved with field ion microscopy and cross checked with field emission. © 2011 American Institute of Physics

Evaluation of the roughness of the surface of porcelain systems with the atomic force microscope

International Nuclear Information System (INIS)

Chavarria Rodriguez, Bernal

2013-01-01

The surface of a dental ceramic was evaluated and compared with an atomic force microscope after being treated with different systems of polishing. 14 identical ceramic Lava® Zirconia discs were used to test the different polishing systems. 3 polishing systems from different matrix houses were used to polish dental porcelain. The samples were evaluated quantitatively with an atomic force microscope in order to study the real effectiveness of each system, on the roughness average (Ra) and the maximum peak to valley roughness (Ry) of the ceramic surfaces. A considerable reduction of the surface roughness was obtained by applying different polishing systems on the surface of dental ceramics. Very reliable values of Ra and Ry were obtained by making measurements on the structure reproduced by the atomic force microscope. The advanced ceramics of zirconium oxide presented the best physical characteristics and low levels of surface roughness. A smoother surface was achieved with the application of polishing systems, thus demonstrating the reduction of the surface roughness of a dental ceramic [es

Novel parallel plate condenser for single particle electrostatic force measurements in atomic force microscope

KAUST Repository

Kwek, Jin Wang

2011-07-01

A combination of small parallel plate condenser with Indium Tin Oxide (ITO) glass slides as electrodes and an atomic force microscope (AFM) is used to characterize the electrostatic behavior of single glass bead microparticles (105-150 μm) glued to the AFM cantilever. This novel setup allows measurements of the electrostatic forces acting on a particle in an applied electrical field to be performed in ambient air conditions. By varying the position of the microparticle between the electrodes and the strength of the applied electric field, the relative contributions of the particle net charge, induced and image charges were investigated. When the microparticle is positioned in the middle of the electrodes, the force acting on the microparticle was linear with the applied electric field and proportional to the microparticle net charge. At distances close to the bottom electrode, the force follows a parabolic relationship with the applied electric field reflecting the contributions of induced and image charges. The method can be used for the rapid evaluation of the charging and polarizability properties of the microparticle as well as an alternative to the conventional Faraday\\'s pail technique. © 2011 Elsevier B.V.

A multifunctional force microscope for soft matter with in situ imaging

Science.gov (United States)

Roberts, Paul; Pilkington, Georgia A.; Wang, Yumo; Frechette, Joelle

2018-04-01

We present the multifunctional force microscope (MFM), a normal and lateral force-measuring instrument with in situ imaging. In the MFM, forces are calculated from the normal and lateral deflection of a cantilever as measured via fiber optic sensors. The motion of the cantilever is controlled normally by a linear micro-translation stage and a piezoelectric actuator, while the lateral motion of the sample is controlled by another linear micro-translation stage. The micro-translation stages allow for travel distances that span 25 mm with a minimum step size of 50 nm, while the piezo has a minimum step size of 0.2 nm, but a 100 μm maximum range. Custom-designed cantilevers allow for the forces to be measured over 4 orders of magnitude (from 50 μN to 1 N). We perform probe tack, friction, and hydrodynamic drainage experiments to demonstrate the sensitivity, versatility, and measurable force range of the instrument.

Microscopic optical potential calculations of finite nuclei with extended skyrme forces

International Nuclear Information System (INIS)

Yuan Haiji; Ye Weilei; Gao Qin; Shen Qingbiao

1986-01-01

Microscopic optical potential calculations in the Hartree-Fock (HF) approximation with Extended Skyrme forces are investigated. The HF equation is derived from the variation principle and the potential formula of spherical nuclei is obtained by two different ways. Then the calculations for symmetrid nuclei 16 O, 40 Ca and asymmetric nucleus 90 Zr with eight sets of Skyrme force parameters are presented. Our results show that the potential form and variating tendency with incident energy are reasonable and there apparently appears a 'wine-bottle-bottom' shape in the intermediate energy region. Furthermore, our calculations reflect shell effects clearly

A wireless centrifuge force microscope (CFM) enables multiplexed single-molecule experiments in a commercial centrifuge.

Science.gov (United States)

Hoang, Tony; Patel, Dhruv S; Halvorsen, Ken

2016-08-01

The centrifuge force microscope (CFM) was recently introduced as a platform for massively parallel single-molecule manipulation and analysis. Here we developed a low-cost and self-contained CFM module that works directly within a commercial centrifuge, greatly improving accessibility and ease of use. Our instrument incorporates research grade video microscopy, a power source, a computer, and wireless transmission capability to simultaneously monitor many individually tethered microspheres. We validated the instrument by performing single-molecule force shearing of short DNA duplexes. For a 7 bp duplex, we observed over 1000 dissociation events due to force dependent shearing from 2 pN to 12 pN with dissociation times in the range of 10-100 s. We extended the measurement to a 10 bp duplex, applying a 12 pN force clamp and directly observing single-molecule dissociation over an 85 min experiment. Our new CFM module facilitates simple and inexpensive experiments that dramatically improve access to single-molecule analysis.

New implementation of a shear-force microscope suitable to study topographical features over wide areas

International Nuclear Information System (INIS)

Ustione, A.; Cricenti, A.; Piacentini, M.; Felici, A. C.

2006-01-01

A new implementation of a shear-force microscope is described that uses a shear-force detection system to perform topographical imaging of large areas (∼1x1 mm 2 ). This implementation finds very interesting application in the study of archeological or artistic samples. Three dc motors are used to move a sample during a scan, allowing the probe tip to follow the surface and to face height differences of several tens of micrometers. This large-area topographical imaging mode exploits new subroutines that were added to the existing homemade software; these subroutines were created in Microsoft VISUAL BASIC 6.0 programming language. With this new feature our shear-force microscope can be used to study topographical details over large areas of archaeological samples in a nondestructive way. We show results detecting worn reliefs over a coin

Calibration of an interfacial force microscope for MEMS metrology : FY08-09 activities.

Energy Technology Data Exchange (ETDEWEB)

Houston, Jack E.; Baker, Michael Sean; Crowson, Douglas A.; Mitchell, John Anthony; Moore, Nathan W.

2009-10-01

Progress in MEMS fabrication has enabled a wide variety of force and displacement sensing devices to be constructed. One device under intense development at Sandia is a passive shock switch, described elsewhere (Mitchell 2008). A goal of all MEMS devices, including the shock switch, is to achieve a high degree of reliability. This, in turn, requires systematic methods for validating device performance during each iteration of design. Once a design is finalized, suitable tools are needed to provide quality assurance for manufactured devices. To ensure device performance, measurements on these devices must be traceable to NIST standards. In addition, accurate metrology of MEMS components is needed to validate mechanical models that are used to design devices to accelerate development and meet emerging needs. Progress towards a NIST-traceable calibration method is described for a next-generation, 2D Interfacial Force Microscope (IFM) for applications in MEMS metrology and qualification. Discussed are the results of screening several suitable calibration methods and the known sources of uncertainty in each method.

Combined laser and atomic force microscope lithography on aluminum: Mask fabrication for nanoelectromechanical systems

DEFF Research Database (Denmark)

Berini, Abadal Gabriel; Boisen, Anja; Davis, Zachary James

1999-01-01

A direct-write laser system and an atomic force microscope (AFM) are combined to modify thin layers of aluminum on an oxidized silicon substrate, in order to fabricate conducting and robust etch masks with submicron features. These masks are very well suited for the production of nanoelectromecha......A direct-write laser system and an atomic force microscope (AFM) are combined to modify thin layers of aluminum on an oxidized silicon substrate, in order to fabricate conducting and robust etch masks with submicron features. These masks are very well suited for the production...... writing, and to perform submicron modifications by AFM oxidation. The mask fabrication for a nanoscale suspended resonator bridge is used to illustrate the advantages of this combined technique for NEMS. (C) 1999 American Institute of Physics. [S0003-6951(99)00221-1]....

Atomic force microscope with combined FTIR-Raman spectroscopy having a micro thermal analyzer

Science.gov (United States)

Fink, Samuel D [Aiken, SC; Fondeur, Fernando F [North Augusta, SC

2011-10-18

An atomic force microscope is provided that includes a micro thermal analyzer with a tip. The micro thermal analyzer is configured for obtaining topographical data from a sample. A raman spectrometer is included and is configured for use in obtaining chemical data from the sample.

Spring constant calibration of atomic force microscope cantilevers of arbitrary shape

Energy Technology Data Exchange (ETDEWEB)

Sader, John E. [Department of Mathematics and Statistics, University of Melbourne, Victoria 3010 (Australia); Kavli Nanoscience Institute and Department of Physics, California Institute of Technology, Pasadena, California 91125 (United States); Sanelli, Julian A.; Adamson, Brian D.; Bieske, Evan J. [School of Chemistry, University of Melbourne, Victoria 3010 (Australia); Monty, Jason P.; Marusic, Ivan [Department of Mechanical Engineering, University of Melbourne, Victoria 3010 (Australia); Wei Xingzhan; Mulvaney, Paul [School of Chemistry, University of Melbourne, Victoria 3010 (Australia); Bio21 Institute, University of Melbourne, Victoria 3010 (Australia); Crawford, Simon A. [School of Botany, University of Melbourne, Victoria 3010 (Australia); Friend, James R. [Melbourne Centre for Nanofabrication, Clayton, Victoria 3800 (Australia); MicroNanophysics Research Laboratory, RMIT University, Melbourne, Victoria 3001 (Australia)

2012-10-15

The spring constant of an atomic force microscope cantilever is often needed for quantitative measurements. The calibration method of Sader et al. [Rev. Sci. Instrum. 70, 3967 (1999)] for a rectangular cantilever requires measurement of the resonant frequency and quality factor in fluid (typically air), and knowledge of its plan view dimensions. This intrinsically uses the hydrodynamic function for a cantilever of rectangular plan view geometry. Here, we present hydrodynamic functions for a series of irregular and non-rectangular atomic force microscope cantilevers that are commonly used in practice. Cantilever geometries of arrow shape, small aspect ratio rectangular, quasi-rectangular, irregular rectangular, non-ideal trapezoidal cross sections, and V-shape are all studied. This enables the spring constants of all these cantilevers to be accurately and routinely determined through measurement of their resonant frequency and quality factor in fluid (such as air). An approximate formulation of the hydrodynamic function for microcantilevers of arbitrary geometry is also proposed. Implementation of the method and its performance in the presence of uncertainties and non-idealities is discussed, together with conversion factors for the static and dynamic spring constants of these cantilevers. These results are expected to be of particular value to the design and application of micro- and nanomechanical systems in general.

Spring constant calibration of atomic force microscope cantilevers of arbitrary shape

International Nuclear Information System (INIS)

Sader, John E.; Sanelli, Julian A.; Adamson, Brian D.; Bieske, Evan J.; Monty, Jason P.; Marusic, Ivan; Wei Xingzhan; Mulvaney, Paul; Crawford, Simon A.; Friend, James R.

2012-01-01

The spring constant of an atomic force microscope cantilever is often needed for quantitative measurements. The calibration method of Sader et al. [Rev. Sci. Instrum. 70, 3967 (1999)] for a rectangular cantilever requires measurement of the resonant frequency and quality factor in fluid (typically air), and knowledge of its plan view dimensions. This intrinsically uses the hydrodynamic function for a cantilever of rectangular plan view geometry. Here, we present hydrodynamic functions for a series of irregular and non-rectangular atomic force microscope cantilevers that are commonly used in practice. Cantilever geometries of arrow shape, small aspect ratio rectangular, quasi-rectangular, irregular rectangular, non-ideal trapezoidal cross sections, and V-shape are all studied. This enables the spring constants of all these cantilevers to be accurately and routinely determined through measurement of their resonant frequency and quality factor in fluid (such as air). An approximate formulation of the hydrodynamic function for microcantilevers of arbitrary geometry is also proposed. Implementation of the method and its performance in the presence of uncertainties and non-idealities is discussed, together with conversion factors for the static and dynamic spring constants of these cantilevers. These results are expected to be of particular value to the design and application of micro- and nanomechanical systems in general.

Digital phase-shifting atomic force microscope Moire method

International Nuclear Information System (INIS)

Liu Chiaming; Chen Lienwen

2005-01-01

In this study, the digital atomic force microscope (AFM) Moire method with phase-shifting technology is established to measure the in-plane displacement and strain fields. The Moire pattern is generated by the interference between the specimen grating and the virtual reference grating formed by digital image processes. The overlapped image is filtered by two-dimensional wavelet transformation to obtain the clear interference Moire patterns. The four-step phase-shifting method is realized by translating the phase of the virtual reference grating from 0 to 2π. The principle of the digital AFM Moire method and the phase-shifting technology are described in detail. Experimental results show that this method is convenient to use and efficient in realizing the microscale measurement

Surface topography characterization using an atomic force microscope mounted on a coordinate measuring machine

DEFF Research Database (Denmark)

De Chiffre, Leonardo; Hansen, H.N; Kofod, N

1999-01-01

The paper describes the construction, testing and use of an integrated system for topographic characterization of fine surfaces on parts having relatively big dimensions. An atomic force microscope (AFM) was mounted on a manual three-coordinate measuring machine (CMM) achieving free positioning o...

Robust approach to maximize the range and accuracy of force application in atomic force microscopes with nonlinear position-sensitive detectors

International Nuclear Information System (INIS)

Silva, E C C M; Vliet, K J van

2006-01-01

The atomic force microscope is used increasingly to investigate the mechanical properties of materials via sample displacement under an applied force. However, both the extent of forces attainable and the accuracy of those forces measurements are significantly limited by the optical lever configuration that is commonly used to infer nanoscale deflection of the cantilever. We present a robust and general approach to characterize and compensate for the nonlinearity of the position-sensitive optical device via data processing, requiring no modification of existing instrumentation. We demonstrate that application of this approach reduced the maximum systematic error on the gradient of a force-displacement response from 50% to 5%, and doubled the calibrated force application range. Finally, we outline an experimental protocol that optimizes the use of the quasi-linear range of the most commonly available optical feedback configurations and also accounts for the residual systematic error, allowing the user to benefit from the full detection range of these indirect force sensors

Microscopic Theory for the Role of Attractive Forces in the Dynamics of Supercooled Liquids.

Science.gov (United States)

Dell, Zachary E; Schweizer, Kenneth S

2015-11-13

We formulate a microscopic, no adjustable parameter, theory of activated relaxation in supercooled liquids directly in terms of the repulsive and attractive forces within the framework of pair correlations. Under isochoric conditions, attractive forces can nonperturbatively modify slow dynamics, but at high enough density their influence vanishes. Under isobaric conditions, attractive forces play a minor role. High temperature apparent Arrhenius behavior and density-temperature scaling are predicted. Our results are consistent with recent isochoric simulations and isobaric experiments on a deeply supercooled molecular liquid. The approach can be generalized to treat colloidal gelation and glass melting, and other soft matter slow dynamics problems.

Quantitative comparison of two independent lateral force calibration techniques for the atomic force microscope

International Nuclear Information System (INIS)

Barkley, Sarice S.; Cannara, Rachel J.; Deng Zhao; Gates, Richard S.; Reitsma, Mark G.

2012-01-01

Two independent lateral-force calibration methods for the atomic force microscope (AFM)--the hammerhead (HH) technique and the diamagnetic lateral force calibrator (D-LFC)--are systematically compared and found to agree to within 5% or less, but with precision limited to about 15%, using four different tee-shaped HH reference probes. The limitations of each method, both of which offer independent yet feasible paths toward traceable accuracy, are discussed and investigated. We find that stiff cantilevers may produce inconsistent D-LFC values through the application of excessively high normal loads. In addition, D-LFC results vary when the method is implemented using different modes of AFM feedback control, constant height and constant force modes, where the latter is more consistent with the HH method and closer to typical experimental conditions. Specifically, for the D-LFC apparatus used here, calibration in constant height mode introduced errors up to 14 %. In constant force mode using a relatively stiff cantilever, we observed an ≅ 4 % systematic error per μN of applied load for loads ≤ 1 μN. The issue of excessive load typically emerges for cantilevers whose flexural spring constant is large compared with the normal spring constant of the D-LFC setup (such that relatively small cantilever flexural displacements produce relatively large loads). Overall, the HH method carries a larger uncertainty, which is dominated by uncertainty in measurement of the flexural spring constant of the HH cantilever as well as in the effective length dimension of the cantilever probe. The D-LFC method relies on fewer parameters and thus has fewer uncertainties associated with it. We thus show that it is the preferred method of the two, as long as care is taken to perform the calibration in constant force mode with low applied loads.

Radical Chemistry and Charge Manipulation with an Atomic Force Microscope

Science.gov (United States)

Gross, Leo

The fuctionalization of tips by atomic manipulation dramatically increased the resolution of atomic force microscopy (AFM). The combination of high-resolution AFM with atomic manipulation now offers the unprecedented possibility to custom-design individual molecules by making and breaking bonds with the tip of the microscope and directly characterizing the products on the atomic scale. We recently applied this technique to generate and study reaction intermediates and to investigate chemical reactions trigged by atomic manipulation. We formed diradicals by dissociating halogen atoms and then reversibly triggered ring-opening and -closing reactions via atomic manipulation, allowing us to switch and control the molecule's reactivity, magnetic and optical properties. Additional information about charge states and charge distributions can be obtained by Kelvin probe force spectroscopy. On multilayer insulating films we investigated single-electron attachment, detachment and transfer between individual molecules. EU ERC AMSEL (682144), EU project PAMS (610446).

Site-controlled quantum dots fabricated using an atomic-force microscope assisted technique

Directory of Open Access Journals (Sweden)

Sakuma Y

2006-01-01

Full Text Available AbstractAn atomic-force microscope assisted technique is developed to control the position and size of self-assembled semiconductor quantum dots (QDs. Presently, the site precision is as good as ± 1.5 nm and the size fluctuation is within ± 5% with the minimum controllable lateral diameter of 20 nm. With the ability of producing tightly packed and differently sized QDs, sophisticated QD arrays can be controllably fabricated for the application in quantum computing. The optical quality of such site-controlled QDs is found comparable to some conventionally self-assembled semiconductor QDs. The single dot photoluminescence of site-controlled InAs/InP QDs is studied in detail, presenting the prospect to utilize them in quantum communication as precisely controlled single photon emitters working at telecommunication bands.

The atomic force microscope as a mechano–electrochemical pen

Directory of Open Access Journals (Sweden)

Christian Obermair

2011-10-01

Full Text Available We demonstrate a method that allows the controlled writing of metallic patterns on the nanometer scale using the tip of an atomic force microscope (AFM as a “mechano–electrochemical pen”. In contrast to previous experiments, no voltage is applied between the AFM tip and the sample surface. Instead, a passivated sample surface is activated locally due to lateral forces between the AFM tip and the sample surface. In this way, the area of tip–sample interaction is narrowly limited by the mechanical contact between tip and sample, and well-defined metallic patterns can be written reproducibly. Nanoscale structures and lines of copper were deposited, and the line widths ranged between 5 nm and 80 nm, depending on the deposition parameters. A procedure for the sequential writing of metallic nanostructures is introduced, based on the understanding of the passivation process. The mechanism of this mechano–electrochemical writing technique is investigated, and the processes of site-selective surface depassivation, deposition, dissolution and repassivation of electrochemically deposited nanoscale metallic islands are studied in detail.

Functionalization of gold and nanocrystalline diamond atomic force microscope tips for single molecule force spectroscopy

Science.gov (United States)

Drew, Michael E.

The atomic force microscope (AFM) has fueled interest in nanotechnology because of its ability to image surfaces at the nanometer level and act as a molecular force sensor. Functionalization of the surface of an AFM tip surface in a stable, controlled manner expands the capabilities of the AFM and enables additional applications in the fields of single molecule force spectroscopy and nanolithography. Two AFM tip functionalizations are described: the assembly of tripodal molecular tips onto gold AFM tips and the photochemical attachment of terminal alkenes to nanocrystalline diamond (NCD) AFM tips. Two separate tripodal molecules with different linker lengths and a monopodal molecule terminated with biotin were synthesized to attach to a gold AFM tip for single molecule force spectroscopy. The immobilization of these molecules was examined by contact angle measurements, spectroscopic ellipsometry, infrared, and near edge x-ray absorption fine structure (NEXAFS) spectroscopy. All three molecules displayed rupture forces that agreed with previously reported values for the biotin--avidin rupture. The tripodal molecular tip displayed narrower distribution in their force histograms than the monopodal molecular tip. The performance of the tripodal molecular tip was compared to the monopodal molecular tip in single molecule force spectroscopy studies. Over repeated measurements, the distribution of forces for the monopodal molecular tip shifted to lower forces, whereas the distribution for the tripodal molecular tip remained constant throughout. Loading rate dependence and control experiments further indicated that the rupture forces of the tripod molecular tips were specific to the biotin--NeutrAvidin interaction. The second functionalization method used the photochemical attachment of undecylenic acid to NCD AFM tips. The photochemical attachment of undecylenic acid to hydrogen-terminated NCD wafer surfaces was investigated by contact angle measurements, x

Reliable measurement of elastic modulus of cells by nanoindentation in an atomic force microscope

KAUST Repository

Zhou, Zhoulong; Ngan, Alfonso H W; Tang, Bin; Wang, Anxun

2012-01-01

The elastic modulus of an oral cancer cell line UM1 is investigated by nanoindentation in an atomic force microscope with a flat-ended tip. The commonly used Hertzian method gives apparent elastic modulus which increases with the loading rate, indicating strong effects of viscoelasticity. On the contrary, a rate-jump method developed for viscoelastic materials gives elastic modulus values which are independent of the rate-jump magnitude. The results show that the rate-jump method can be used as a standard protocol for measuring elastic stiffness of living cells, since the measured values are intrinsic properties of the cells. © 2011 Elsevier Ltd.

Reliable measurement of elastic modulus of cells by nanoindentation in an atomic force microscope

KAUST Repository

Zhou, Zhoulong

2012-04-01

The elastic modulus of an oral cancer cell line UM1 is investigated by nanoindentation in an atomic force microscope with a flat-ended tip. The commonly used Hertzian method gives apparent elastic modulus which increases with the loading rate, indicating strong effects of viscoelasticity. On the contrary, a rate-jump method developed for viscoelastic materials gives elastic modulus values which are independent of the rate-jump magnitude. The results show that the rate-jump method can be used as a standard protocol for measuring elastic stiffness of living cells, since the measured values are intrinsic properties of the cells. © 2011 Elsevier Ltd.

Surface features on Sahara soil dust particles made visible by atomic force microscope (AFM) phase images

OpenAIRE

G. Helas; M. O. Andreae

2008-01-01

We show that atomic force microscopy (AFM) phase images can reveal surface features of soil dust particles, which are not evident using other microscopic methods. The non-contact AFM method is able to resolve topographical structures in the nanometer range as well as to uncover repulsive atomic forces and attractive van der Waals' forces, and thus gives insight to surface properties. Though the method does not allow quantitative assignment in terms of chemical compound description, it clearly...

An atomic force microscope for the study of the effects of tip sample interactions on dimensional metrology

Science.gov (United States)

Yacoot, Andrew; Koenders, Ludger; Wolff, Helmut

2007-02-01

An atomic force microscope (AFM) has been developed for studying interactions between the AFM tip and the sample. Such interactions need to be taken into account when making quantitative measurements. The microscope reported here has both the conventional beam deflection system and a fibre optical interferometer for measuring the movement of the cantilever. Both can be simultaneously used so as to not only servo control the tip movements, but also detect residual movement of the cantilever. Additionally, a high-resolution homodyne differential optical interferometer is used to measure the vertical displacement between the cantilever holder and the sample, thereby providing traceability for vertical height measurements. The instrument is compatible with an x-ray interferometer, thereby facilitating high resolution one-dimensional scans in the X-direction whose metrology is based on the silicon d220 lattice spacing (0.192 nm). This paper concentrates on the first stage of the instrument's development and presents some preliminary results validating the instrument's performance and showing its potential.

Measuring minority-carrier diffusion length using a Kelvin probe force microscope

International Nuclear Information System (INIS)

Shikler, R.; Fried, N.; Meoded, T.; Rosenwaks, Y.

2000-01-01

A method based on Kelvin probe force microscopy for measuring minority-carrier diffusion length in semiconductors is described. The method is based on measuring the surface photovoltage between the tip of an atomic force microscope and the surface of an illuminated semiconductor junction. The photogenerated carriers diffuse to the junction and change the contact potential difference between the tip and the sample, as a function of the distance from the junction. The diffusion length L is then obtained by fitting the measured contact potential difference using the minority-carrier continuity equation. The method was applied to measurements of electron diffusion length in GaP pn and Schottky junctions. The measured diffusion length was found to be ∼2 μm, in good agreement with electron beam induced current measurements

An open source/real-time atomic force microscope architecture to perform customizable force spectroscopy experiments.

Science.gov (United States)

Materassi, Donatello; Baschieri, Paolo; Tiribilli, Bruno; Zuccheri, Giampaolo; Samorì, Bruno

2009-08-01

We describe the realization of an atomic force microscope architecture designed to perform customizable experiments in a flexible and automatic way. Novel technological contributions are given by the software implementation platform (RTAI-LINUX), which is free and open source, and from a functional point of view, by the implementation of hard real-time control algorithms. Some other technical solutions such as a new way to estimate the optical lever constant are described as well. The adoption of this architecture provides many degrees of freedom in the device behavior and, furthermore, allows one to obtain a flexible experimental instrument at a relatively low cost. In particular, we show how such a system has been employed to obtain measures in sophisticated single-molecule force spectroscopy experiments [Fernandez and Li, Science 303, 1674 (2004)]. Experimental results on proteins already studied using the same methodologies are provided in order to show the reliability of the measure system.

Observation of ferromagnetic resonance in a microscopic sample using magnetic resonance force microscopy

International Nuclear Information System (INIS)

Zhang, Z.; Hammel, P.C.; Wigen, P.E.

1996-01-01

We report the observation of a ferromagnetic resonance signal arising from a microscopic (∼20μmx40μm) particle of thin (3μm) yttrium iron garnet film using magnetic resonance force microscopy (MRFM). The large signal intensity in the resonance spectra suggests that MRFM could become a powerful microscopic ferromagnetic resonance technique with a micron or sub-micron resolution. We also observe a very strong nonresonance signal which occurs in the field regime where the sample magnetization readily reorients in response to the modulation of the magnetic field. This signal will be the main noise source in applications where a magnet is mounted on the cantilever. copyright 1996 American Institute of Physics

High frequency write head measurement with the phase detection magnetic force microscope

International Nuclear Information System (INIS)

Abe, M.; Tanaka, Y.

2001-01-01

We demonstrated the measurement of the high frequency (HF) magnetic field of a write head with the phase detection magnetic force microscope. An amplitude-modulated current was applied to the head coil to detect the force gradient induced by the HF magnetic field. Spatial resolution of this method was higher than that of the deflection detection method previously proposed. By the phase detection method, dynamic HF magnetic fields at the poles of the write heads were clearly imaged. HF magnetic field leakage was observed along the P2 pole shape on the air-bearing surface. The frequency dependence of the write head dynamics up to 350 MHz was also investigated. [copyright] 2001 American Institute of Physics

Advanced atomic force microscopy: Development and application

Science.gov (United States)

Walters, Deron A.

Over the decade since atomic force microscopy (AFM) was invented, development of new microscopes has been closely intertwined with application of AFM to problems of interest in physics, chemistry, biology, and engineering. New techniques such as tapping mode AFM move quickly in our lab from the designer's bench to the user's table-since this is often the same piece of furniture. In return, designers get ample feedback as to what problems are limiting current instruments, and thus need most urgent attention. Tip sharpness and characterization are such a problem. Chapter 1 describes an AFM designed to operate in a scanning electron microscope, whose electron beam is used to deposit sharp carbonaceous tips. These tips can be tested and used in situ. Another limitation is addressed in Chapter 2: the difficulty of extracting more than just topographic information from a sample. A combined AFM/confocal optical microscope was built to provide simultaneous, independent images of the topography and fluorescence of a sample. In combination with staining or antibody labelling, this could provide submicron information about the composition of a sample. Chapters 3 and 4 discuss two generations of small cantilevers developed for lower-noise, higher-speed AFM of biological samples. In Chapter 4, a 26 mum cantilever is used to image the process of calcite growth from solution at a rate of 1.6 sec/frame. Finally, Chapter 5 explores in detail a biophysics problem that motivates us to develop fast, quiet, and gentle microscopes; namely, the control of crystal growth in seashells by the action of soluble proteins on a growing calcite surface.

Microscopic derivation of the force on a dielectric fluid in an electromagnetic field

International Nuclear Information System (INIS)

Lai, H.M.; Suen, W.M.; Young, K.

1982-01-01

The force acting on a Clausius-Mossotti fluid in an electromagnetic field is evaluated microscopically. Owing to the modification of the two-particle density by the electric field, an additional mechanical force Δf/sup( M/) is found. When this is added to the electrical force f/sup( E/), the total force in the static case becomes identical to that deduced macroscopically by Helmholtz. The analysis is extended to various time-dependent cases, and it is pointed out that Δf/sup( M/) essentially assumes its static value on time scales longer than T/sub c/, the relaxation time of the two-particle density, but is otherwise negligibly small. Thus Peierls's theory of the momentum of light is valid only for pulses much shorter than T/sub c/; the necessary correction due to Δf/sup( M/) in other cases is given and discussed

Novel scanning probe microscope instrumentation with applications in nanotechnology

International Nuclear Information System (INIS)

Humphry, M.J.

2000-10-01

A versatile scanning probe microscope controller has been constructed. Its suitability for the control of a range of different scanning probe microscope heads has been demonstrated. These include an ultra high vacuum scanning tunnelling microscope, with which atomic resolution images of Si surfaces was obtained, a custom-built atomic force microscope, and a custom-built photon emission scanning tunnelling microscope. The controller has been designed specifically to facilitate data acquisition during molecular manipulation experiments. Using the controller, the fullerene molecule C 60 has been successfully manipulated on Si(100)-2x1 surfaces and detailed data has been acquired during the manipulation process. Evidence for two distinct modes of manipulation have been observed. A repulsive mode with success rates up to 90% was found to occur with tunnel gap impedances below 2GΩ, while between 2GΩ and 8GΩ attractive manipulation events were observed, with a maximum success rate of ∼8%. It was also found that the step size between feedback updates had a significant effect on tip stability, and that dwell time of the STM tip at each data point had a critical effect on manipulation probability. A multi-function scanning probe microscope head has been developed capable of operation as a scanning tunnelling microscope and an atomic force microscope in vacuum and a magnetic field of 7T. The custom-built controller also presented here was used to control the head. A three-axis inertial sliding motor was developed for the head, capable of reproducible step sizes of <1000A. In addition, an optical fibre interferometer was constructed with a sensitivity of 0.2A/√Hz. Preliminary development of a magnetic resonance force microscope mode has also been performed, with initial results showing such a system to be feasible. (author)

A new theoretical probe for the magnetic force microscope

Energy Technology Data Exchange (ETDEWEB)

Windmill, J.F.C. E-mail: jwindmill@plymouth.ac.uk; Clegg, W.W.; Jenkins, D.F.L.; Davey, P.J

2001-05-01

The magnetic force microscope (MFM) is established as a valuable tool for the analysis of magnetic structures. The standard design of MFM incorporates a silicon tip coated with a magnetic material. However, these tips are subject to several inherent problems, e.g. changing characteristics over time due to damage or magnetic hysteresis. A new theoretical electromagnetic MFM probe is introduced here. Although electromagnetic MFM has been discussed before by Zhou et al. (J. Vac. Sci. Technol. A 17 (1999) 2233), the design presented here is a different approach. Two different probe iterations and their magnetic field intensity distribution are modelled. The probe imaging capability is compared using the reciprocity principle (Wright and Hill, Appl. Phys. Lett. 68 (1996) 1726) to image the simulated force interaction between a sample and the probe fields. Thus, images of a sample's magnetic distribution are produced by the convolution of the different probe gradient field distributions and the sample magnetisation. Both perpendicular and longitudinal magnetisation patterns were simulated with the different probe iterations. This clearly showed the improvement of the second probe iteration, particularly for longitudinal patterns. The practical use of the new probe is also discussed, and future work outlined.

Measurements of dispersion forces between colloidal latex particles with the atomic force microscope and comparison with Lifshitz theory

Energy Technology Data Exchange (ETDEWEB)

Elzbieciak-Wodka, Magdalena; Ruiz-Cabello, F. Javier Montes; Trefalt, Gregor; Maroni, Plinio; Borkovec, Michal, E-mail: michal.borkovec@unige.ch [Department of Inorganic and Analytical Chemistry, University of Geneva, Sciences II, 30, Quai Ernest-Ansermet, 1205 Geneva (Switzerland); Popescu, Mihail N. [Ian Wark Research Institute, University of South Australia, Mawson Lakes, SA 5095 (Australia)

2014-03-14

Interaction forces between carboxylate colloidal latex particles of about 2 μm in diameter immersed in aqueous solutions of monovalent salts were measured with the colloidal probe technique, which is based on the atomic force microscope. We have systematically varied the ionic strength, the type of salt, and also the surface charge densities of the particles through changes in the solution pH. Based on these measurements, we have accurately measured the dispersion forces acting between the particles and estimated the apparent Hamaker constant to be (2.0 ± 0.5) × 10{sup −21} J at a separation distance of about 10 nm. This value is basically independent of the salt concentration and the type of salt. Good agreement with Lifshitz theory is found when roughness effects are taken into account. The combination of retardation and roughness effects reduces the value of the apparent Hamaker constant and its ionic strength dependence with respect to the case of ideally smooth surfaces.

Dielectrophoretic positioning of single nanoparticles on atomic force microscope tips for tip-enhanced Raman spectroscopy.

Science.gov (United States)

Leiterer, Christian; Deckert-Gaudig, Tanja; Singh, Prabha; Wirth, Janina; Deckert, Volker; Fritzsche, Wolfgang

2015-05-01

Tip-enhanced Raman spectroscopy, a combination of Raman spectroscopy and scanning probe microscopy, is a powerful technique to detect the vibrational fingerprint of molecules at the nanometer scale. A metal nanoparticle at the apex of an atomic force microscope tip leads to a large enhancement of the electromagnetic field when illuminated with an appropriate wavelength, resulting in an increased Raman signal. A controlled positioning of individual nanoparticles at the tip would improve the reproducibility of the probes and is quite demanding due to usually serial and labor-intensive approaches. In contrast to commonly used submicron manipulation techniques, dielectrophoresis allows a parallel and scalable production, and provides a novel approach toward reproducible and at the same time affordable tip-enhanced Raman spectroscopy tips. We demonstrate the successful positioning of an individual plasmonic nanoparticle on a commercial atomic force microscope tip by dielectrophoresis followed by experimental proof of the Raman signal enhancing capabilities of such tips. © 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

A concept for automated nanoscale atomic force microscope (AFM) measurements using a priori knowledge

International Nuclear Information System (INIS)

Recknagel, C; Rothe, H

2009-01-01

The nanometer coordinate measuring machine (NCMM) is developed for comparatively fast large area scans with high resolution. The system combines a metrological atomic force microscope (AFM) with a precise positioning system. The sample is moved under the probe system via the positioning system achieving a scan range of 25 × 25 × 5 mm 3 with a resolution of 0.1 nm. A concept for AFM measurements using a priori knowledge is implemented. The a priori knowledge is generated through measurements with a white light interferometer and the use of CAD data. Dimensional markup language is used as a transfer and target format for a priori knowledge and measurement data. Using the a priori knowledge and template matching algorithms combined with the optical microscope of the NCMM, the region of interest can automatically be identified. In the next step the automatic measurement of the part coordinate system and the measurement elements with the AFM sensor of the NCMM is done. The automatic measurement involves intelligent measurement strategies, which are adapted to specific geometries of the measurement feature to reduce measurement time and drift effects

A microscopic approach to Casimir and Casimir–Polder forces between metallic bodies

International Nuclear Information System (INIS)

Barcellona, Pablo; Passante, Roberto

2015-01-01

We consider the Casimir–Polder interaction energy between a metallic nanoparticle and a metallic plate, as well as the Casimir interaction energy between two macroscopic metal plates, in terms of the many-body dispersion interactions between their constituents. Expressions for two- and three-body dispersion interactions between the microscopic parts of a real metal are first obtained, both in the retarded and non-retarded limits. These expressions are then used to evaluate the overall two- and three-body contributions to the macroscopic Casimir–Polder and Casimir force, and to compare them with each other, for the two following geometries: metal nanoparticle/half-space and half-space/half-space, where all the materials are assumed perfect conductors. The above evaluation is obtained by summing up the contributions from the microscopic constituents of the bodies (metal nanoparticles). In the case of nanoparticle/half-space, our results fully agree with those that can be extracted from the corresponding macroscopic results, and explicitly show the non-applicability of the pairwise approximation for the geometry considered. In both cases, we find that, while the overall two-body contribution yields an attractive force, the overall three-body contribution is repulsive. Also, they turn out to be of the same order, consistently with the known non applicability of the pairwise approximation. The issue of the rapidity of convergence of the many-body expansion is also briefly discussed

A more comprehensive modeling of atomic force microscope cantilever

International Nuclear Information System (INIS)

Mahdavi, M.H.; Farshidianfar, A.; Tahani, M.; Mahdavi, S.; Dalir, H.

2008-01-01

This paper focuses on the development of a complete model of an atomic force microscope (AFM) micro-cantilever beam, based on considering the effects of four major factors in modeling the cantilever. They are: rotary inertia and shear deformation of the beam and mass and rotary inertia of the tip. A method based on distributed-parameter modeling approach is proposed to solve the governing equations. The comparisons generally show a very good agreement between the present results and the results of other investigators. As expected, rotary inertia and shear deformation of the beam decrease resonance frequency especially at high ratio of cantilever thickness to its length, and it is relatively more pronounced for higher-order frequencies, than lower ones. Mass and rotary inertia of the tip have similar effects when the mass-ratio of the tip to the cantilever is high. Moreover, the influence of each of these four factors, thickness of the cantilever, density of the tip and inclination of the cantilever on the resonance frequencies has been investigated, separately. It is felt that this work might help the engineers in reducing AFM micro-cantilever design time, by providing insight into the effects of various parameters with the micro-cantilever.

A Novel Atomic Force Microscope with Multi-Mode Scanner

International Nuclear Information System (INIS)

Qin, Chun; Zhang, Haijun; Xu, Rui; Han, Xu; Wang, Shuying

2016-01-01

A new type of atomic force microscope (AFM) with multi-mode scanner is proposed. The AFM system provides more than four scanning modes using a specially designed scanner with three tube piezoelectric ceramics and three stack piezoelectric ceramics. Sample scanning of small range with high resolution can be realized by using tube piezos, meanwhile, large range scanning can be achieved by stack piezos. Furthermore, the combination with tube piezos and stack piezos not only realizes high-resolution scanning of small samples with large- scale fluctuation structure, but also achieves small range area-selecting scanning. Corresponding experiments are carried out in terms of four different scanning modes showing that the AFM is of reliable stability, high resolution and can be widely applied in the fields of micro/nano-technology. (paper)

Switched capacitor charge pump used for low-distortion imaging in atomic force microscope.

Science.gov (United States)

Zhang, Jie; Zhang, Lian Sheng; Feng, Zhi Hua

2015-01-01

The switched capacitor charge pump (SCCP) is an effective method of linearizing charges on piezoelectric actuators and therefore constitute a significant approach to nano-positioning. In this work, it was for the first time implemented in an atomic force microscope for low-distortion imaging. Experimental results showed that the image quality was improved evidently under the SCCP drive compared with that under traditional linear voltage drive. © Wiley Periodicals, Inc.

Near-field optical microscope using a silicon-nitride probe

NARCIS (Netherlands)

van Hulst, N.F.; Moers, M.H.P.; Moers, M.H.P.; Noordman, O.F.J.; Noordman, O.F.J.; Tack, R.G.; Segerink, Franciscus B.; Bölger, B.; Bölger, B.

1993-01-01

Operation of an alternative near-field optical microscope is presented. The microscope uses a microfabricated silicon- nitride probe with integrated cantilever, as originally developed for force microscopy. The cantilever allows routine close contact near-field imaging o­n arbitrary surfaces without

Towards quantitative determination of the spring constant of a scanning force microscope cantilever with a microelectromechanical nano-force actuator

International Nuclear Information System (INIS)

Gao, Sai; Herrmann, Konrad; Zhang, Zhikai; Wu, Yong

2010-01-01

The calibration of the performance of an SFM (scanning force microscope) cantilever has gained more and more interest in the past years, particularly due to increasing applications of SFMs for the determination of the mechanical properties of materials, such as biological structures and organic molecules. In this paper, a MEMS-based nano-force actuator with a force resolution up to nN (10 −9 N) is presented to quantitatively determine the stiffness of an SFM cantilever. The principle, structure design and realization of the nano-force actuator are detailed. Preliminary experiments demonstrate that the long-term self-calibration stability of the actuator is better than 3.7 × 10 −3 N m −1 (1σ) over 1 h. With careful calibration of the stiffness of the actuator, the MEMS actuator has the capability to determine the stiffness of various types of cantilevers (from 100 N m −1 down to 0.1 N m −1 ) with high accuracy. In addition, thanks to the large displacement and force range (up to 8 µm and 1 mN, respectively) of the actuator, the calibration procedure with our MEMS nano-force actuator features simple and active operation, and therefore applicability for different types of quantitative SFMs

Electromechanical Characterization of Single GaN Nanobelt Probed with Conductive Atomic Force Microscope

Science.gov (United States)

Yan, X. Y.; Peng, J. F.; Yan, S. A.; Zheng, X. J.

2018-04-01

The electromechanical characterization of the field effect transistor based on a single GaN nanobelt was performed under different loading forces by using a conductive atomic force microscope (C-AFM), and the effective Schottky barrier height (SBH) and ideality factor are simulated by the thermionic emission model. From 2-D current image, the high value of the current always appears on the nanobelt edge with the increase of the loading force less than 15 nN. The localized (I-V) characteristic reveals a typical rectifying property, and the current significantly increases with the loading force at the range of 10-190 nN. The ideality factor is simulated as 9.8 within the scope of GaN nano-Schottky diode unity (6.5-18), therefore the thermionic emission current is dominant in the electrical transport of the GaN-tip Schottky junction. The SBH is changed through the piezoelectric effect induced by the loading force, and it is attributed to the enhanced current. Furthermore, a single GaN nanobelt has a high mechanical-induced current ratio that could be made use of in a nanoelectromechanical switch.

Nanodot deposition and its application with atomic force microscope

Energy Technology Data Exchange (ETDEWEB)

Liu Zenglei, E-mail: liuzenglei@sia.cn; Jiao Niandong, E-mail: ndjiao@sia.cn [Chinese Academy of Sciences, State Key Laboratory of Robotics, Shenyang Institute of Automation (China); Xu Ke [Shenyang Jianzhu University (China); Wang, Zhidong [Chiba Institute of Technology (Japan); Dong Zaili; Liu Lianqing [Chinese Academy of Sciences, State Key Laboratory of Robotics, Shenyang Institute of Automation (China)

2013-06-15

Nanodot deposition using atomic force microscope (AFM) is investigated. To realize repeatable and precise deposition of nanodots, the detailed control method is discussed. The electric field between AFM tip and substrate is analyzed, and a convenient method to control tip-substrate separation is proposed. In experiments, two nanodot matrixes are fabricated and the heights of the nanodots are analyzed. Experimental results testify that the control method can lead to repeatable and precise fabrication of deposited nanodots. As an application of deposited nanodots, a carbon nanotube (CNT) is soldered on gold electrodes with deposited Au nanodots. After soldering, the contact resistances between the CNT and the electrodes decrease greatly. AFM-based nanodot deposition can be used to fabricate special nanopatterns; also it can be used to solder nanomaterials on substrates to improve the electrical connection, which has a promising future for nanodevice fabrication.

Tip Effect of the Tapping Mode of Atomic Force Microscope in Viscous Fluid Environments.

Science.gov (United States)

Shih, Hua-Ju; Shih, Po-Jen

2015-07-28

Atomic force microscope with applicable types of operation in a liquid environment is widely used to scan the contours of biological specimens. The contact mode of operation allows a tip to touch a specimen directly but sometimes it damages the specimen; thus, a tapping mode of operation may replace the contact mode. The tapping mode triggers the cantilever of the microscope approximately at resonance frequencies, and so the tip periodically knocks the specimen. It is well known that the cantilever induces extra liquid pressure that leads to drift in the resonance frequency. Studies have noted that the heights of protein surfaces measured via the tapping mode of an atomic force microscope are ~25% smaller than those measured by other methods. This discrepancy may be attributable to the induced superficial hydrodynamic pressure, which is worth investigating. In this paper, we introduce a semi-analytical method to analyze the pressure distribution of various tip geometries. According to our analysis, the maximum hydrodynamic pressure on the specimen caused by a cone-shaped tip is ~0.5 Pa, which can, for example, pre-deform a cell by several nanometers in compression before the tip taps it. Moreover, the pressure calculated on the surface of the specimen is 20 times larger than the pressure without considering the tip effect; these results have not been motioned in other papers. Dominating factors, such as surface heights of protein surface, mechanical stiffness of protein increasing with loading velocity, and radius of tip affecting the local pressure of specimen, are also addressed in this study.

Detection of erythrocytes influenced by aging and type 2 diabetes using atomic force microscope

Energy Technology Data Exchange (ETDEWEB)

Jin, Hua; Xing, Xiaobo [Chemistry Department, Jinan University, Guangzhou 510632 (China); Zhao, Hongxia [Chemistry Department, Jinan University, Guangzhou 510632 (China); Faculty of Chemical Engineering and Light Industry, Guangdong University of Technology, Guangzhou 510090 (China); Chen, Yong [Institute for Advanced Study, Nanchang University, Nanchang, Jiangxi 330031 (China); Huang, Xun [Chemistry Department, Jinan University, Guangzhou 510632 (China); Ma, Shuyuan [Chemistry Department, Jinan University, Guangzhou 510632 (China); The First Affiliated Hospital, Jinan University, Guangzhou 510632 (China); Ye, Hongyan [Chemistry Department, Jinan University, Guangzhou 510632 (China); Cai, Jiye, E-mail: tjycai@jnu.edu.cn [Chemistry Department, Jinan University, Guangzhou 510632 (China)

2010-01-22

The pathophysiological changes of erythrocytes are detected at the molecular scale, which is important to reveal the onset of diseases. Type 2 diabetes is an age-related metabolic disorder with high prevalence in elderly (or old) people. Up to now, there are no treatments to cure diabetes. Therefore, early detection and the ability to monitor the progression of type 2 diabetes are very important for developing effective therapies. Type 2 diabetes is associated with high blood glucose in the context of insulin resistance and relative insulin deficiency. These abnormalities may disturb the architecture and functions of erythrocytes at molecular scale. In this study, the aging- and diabetes-induced changes in morphological and biomechanical properties of erythrocytes are clearly characterized at nanometer scale using atomic force microscope (AFM). The structural information and mechanical properties of the cell surface membranes of erythrocytes are very important indicators for determining the healthy, diseased or aging status. So, AFM may potentially be developed into a powerful tool in diagnosing diseases.

Detection of erythrocytes influenced by aging and type 2 diabetes using atomic force microscope

International Nuclear Information System (INIS)

Jin, Hua; Xing, Xiaobo; Zhao, Hongxia; Chen, Yong; Huang, Xun; Ma, Shuyuan; Ye, Hongyan; Cai, Jiye

2010-01-01

The pathophysiological changes of erythrocytes are detected at the molecular scale, which is important to reveal the onset of diseases. Type 2 diabetes is an age-related metabolic disorder with high prevalence in elderly (or old) people. Up to now, there are no treatments to cure diabetes. Therefore, early detection and the ability to monitor the progression of type 2 diabetes are very important for developing effective therapies. Type 2 diabetes is associated with high blood glucose in the context of insulin resistance and relative insulin deficiency. These abnormalities may disturb the architecture and functions of erythrocytes at molecular scale. In this study, the aging- and diabetes-induced changes in morphological and biomechanical properties of erythrocytes are clearly characterized at nanometer scale using atomic force microscope (AFM). The structural information and mechanical properties of the cell surface membranes of erythrocytes are very important indicators for determining the healthy, diseased or aging status. So, AFM may potentially be developed into a powerful tool in diagnosing diseases.

Observations of fission-tracks in zircons by atomic force microscope

International Nuclear Information System (INIS)

Ohishi, Shinnosuke; Hasebe, Noriko

2012-01-01

The fission-track (FT) method is a dating technique based on the observation of damage (tracks) by spontaneous fission of 238 U left in a mineral. The date is calculated from the track density and the uranium concentration in the mineral. This is possible because the number of tracks is a function of uranium concentration and time since the start of track accumulation. Usually, the number of tracks is counted under an optical microscope after etching (chemical expansion of a track). However, as FT density per unit area rises, it becomes difficult to count the number of tracks. This is due to the fact that FTs overlap one another and are unable to be readily distinguished. This research examines the potential of atomic force microscope (AFM) for FT dating using zircons, which are likely to show higher FT density than other minerals due to their high U concentrations. To obtain an AFM image for a sample prepared for FT dating, removing the static electricity of the sample is essential to avoid an unexpected movement of the cantilever. A grain should be wider than about 30 μm to bring the cantilever on the mineral surface. Polishing with a fine grained compound is very important. There is not much difference in sharpness between images by AC mode (scanning with vibrating cantilever at a constant cycle) and Contact mode (scanning with the cantilever always in close contact with the surface). To confirm how tracks can be identified with the AFM, an AFM image was compared with an image obtained with the optical microscope. When change in the number of tracks and their shapes were observed through stepwise etching, the track expanded as the etching time increased. In addition, the etching rate was slower for large tracks than those for small tracks. This implied that the AFM can be used to observe etching of zircons with different degrees of nuclear fission damage. A track that could not be seen with the optical microscope due to insufficient etching could be observed by

Atomic imaging of an InSe single-crystal surface with atomic force microscope

OpenAIRE

Uosaki, Kohei; Koinuma, Michio

1993-01-01

The atomic force microscope was employed to observed in air the surface atomic structure of InSe, one of III-VI compound semiconductors with layered structures. Atomic arrangements were observed in both n-type and p-type materials. The observed structures are in good agreement with those expected from bulk crystal structures. The atomic images became less clear by repeating the imaging process. Wide area imaging after the imaging of small area clearly showed that a mound was created at the sp...

MM99.50 - Surface Topography Characterization Using an Atomic Force Microscope Mounted on a Coordinate Measuring Machine

DEFF Research Database (Denmark)

Chiffre, Leonardo De; Hansen, Hans Nørgaard; Kofod, Niels

1999-01-01

The paper describes the construction, testing and use of an integrated system for topographic characterization of fine surfaces on parts having relatively big dimensions. An atomic force microscope (AFM) was mounted on a manual three-coordinate measuring machine (CMM) achieving free positioning o...

Atomic Force Microscope Mediated Chromatography

Science.gov (United States)

Anderson, Mark S.

2013-01-01

The atomic force microscope (AFM) is used to inject a sample, provide shear-driven liquid flow over a functionalized substrate, and detect separated components. This is demonstrated using lipophilic dyes and normal phase chromatography. A significant reduction in both size and separation time scales is achieved with a 25-micron-length column scale, and one-second separation times. The approach has general applications to trace chemical and microfluidic analysis. The AFM is now a common tool for ultra-microscopy and nanotechnology. It has also been demonstrated to provide a number of microfluidic functions necessary for miniaturized chromatography. These include injection of sub-femtoliter samples, fluidic switching, and sheardriven pumping. The AFM probe tip can be used to selectively remove surface layers for subsequent microchemical analysis using infrared and tip-enhanced Raman spectroscopy. With its ability to image individual atoms, the AFM is a remarkably sensitive detector that can be used to detect separated components. These diverse functional components of microfluidic manipulation have been combined in this work to demonstrate AFM mediated chromatography. AFM mediated chromatography uses channel-less, shear-driven pumping. This is demonstrated with a thin, aluminum oxide substrate and a non-polar solvent system to separate a mixture of lipophilic dyes. In conventional chromatographic terms, this is analogous to thin-layer chromatography using normal phase alumina substrate with sheardriven pumping provided by the AFM tip-cantilever mechanism. The AFM detection of separated components is accomplished by exploiting the variation in the localized friction of the separated components. The AFM tip-cantilever provides the mechanism for producing shear-induced flows and rapid pumping. Shear-driven chromatography (SDC) is a relatively new concept that overcomes the speed and miniaturization limitations of conventional liquid chromatography. SDC is based on a

Microscopic to macroscopic depletion model development for FORMOSA-P

International Nuclear Information System (INIS)

Noh, J.M.; Turinsky, P.J.; Sarsour, H.N.

1996-01-01

Microscopic depletion has been gaining popularity with regard to employment in reactor core nodal calculations, mainly attributed to the superiority of microscopic depletion in treating spectral history effects during depletion. Another trend is the employment of loading pattern optimization computer codes in support of reload core design. Use of such optimization codes has significantly reduced design efforts to optimize reload core loading patterns associated with increasingly complicated lattice designs. A microscopic depletion model has been developed for the FORMOSA-P pressurized water reactor (PWR) loading pattern optimization code. This was done for both fidelity improvements and to make FORMOSA-P compatible with microscopic-based nuclear design methods. Needless to say, microscopic depletion requires more computational effort compared with macroscopic depletion. This implies that microscopic depletion may be computationally restrictive if employed during the loading pattern optimization calculation because many loading patterns are examined during the course of an optimization search. Therefore, the microscopic depletion model developed here uses combined models of microscopic and macroscopic depletion. This is done by first performing microscopic depletions for a subset of possible loading patterns from which 'collapsed' macroscopic cross sections are obtained. The collapsed macroscopic cross sections inherently incorporate spectral history effects. Subsequently, the optimization calculations are done using the collapsed macroscopic cross sections. Using this approach allows maintenance of microscopic depletion level accuracy without substantial additional computing resources

Microscopic analysis of the non-dissipative force on a line vortex in a superconductor

International Nuclear Information System (INIS)

Gaitan, F.

1994-12-01

A microscopic analysis of the non-dissipative force F nd acting on a line vortex in a type-II superconductor at T = 0 is given. All work presented assumes a charged BCS superconductor. We first examine the Berry phase induced in the BCS superconducting ground state by movement of the vortex and show how this phase enters into the hydro-dynamic action S hyd of the superconducting condensate. Appropriate variation of S hyd gives F nd and variation of the Berry phase term is seen to contribute the Magnus or lift force of classical hydrodynamics to F nd . This analysis, based on the BCS ground state of a charged superconductor, confirms in detail the arguments of Ao and Thouless within the context of the BCS model. Our Berry phase, in the limit e → 0, is seen to reproduce the Berry phase determined by these authors for a neutral superfluid. We also provide a second, independent, determination on F nd through a microscopic derivation of the continuity equation for the condensate linear momentum. This equation yields the acceleration equation for the superflow and shows that the vortex acts as a sink for the condensate linear momentum. The rate at which momentum is lost to the vortex determines F nd in this second approach and the result obtained agrees identically with the previous Berry phase calculation. The Magnus force contribution to F nd is seen in both calculations to be a consequence of the vortex topology and motion. (author). 10 refs

Surface features on Sahara soil dust particles made visible by atomic force microscope (AFM phase images

Directory of Open Access Journals (Sweden)

M. O. Andreae

2008-10-01

Full Text Available We show that atomic force microscopy (AFM phase images can reveal surface features of soil dust particles, which are not evident using other microscopic methods. The non-contact AFM method is able to resolve topographical structures in the nanometer range as well as to uncover repulsive atomic forces and attractive van der Waals' forces, and thus gives insight to surface properties. Though the method does not allow quantitative assignment in terms of chemical compound description, it clearly shows deposits of distinguishable material on the surface. We apply this technique to dust aerosol particles from the Sahara collected over the Atlantic Ocean and describe micro-features on the surfaces of such particles.

Modification of calcite crystal growth by abalone shell proteins: an atomic force microscope study.

OpenAIRE

Walters, D A; Smith, B L; Belcher, A M; Paloczi, G T; Stucky, G D; Morse, D E; Hansma, P K

1997-01-01

A family of soluble proteins from the shell of Haliotis rufescens was introduced over a growing calcite crystal being scanned in situ by an atomic force microscope (AFM). Atomic step edges on the crystal surface were altered in shape and speed of growth by the proteins. Proteins attached nonuniformly to the surface, indicating different interactions with crystallographically different step edges. The observed changes were consistent with the habit modification induced by this family of protei...

Indirect identification and compensation of lateral scanner resonances in atomic force microscopes

International Nuclear Information System (INIS)

Burns, D J; Youcef-Toumi, K; Fantner, G E

2011-01-01

Improving the imaging speed of atomic force microscopy (AFM) requires accurate nanopositioning at high speeds. However, high speed operation excites resonances in the AFM's mechanical scanner that can distort the image, and therefore typical users of commercial AFMs elect to operate microscopes at speeds below which scanner resonances are observed. Although traditional robust feedforward controllers and input shaping have proven effective at minimizing the influence of scanner distortions, the lack of direct measurement and use of model-based controllers have required disassembling the microscope to access lateral scanner motion with external sensors in order to perform a full system identification experiment, which places excessive demands on routine microscope operators. Further, since the lightly damped instrument dynamics often change from experiment to experiment, model-based controllers designed from offline system identification experiments must trade off high speed performance for robustness to modeling errors. This work represents a new way to automatically characterize the lateral scanner dynamics without addition of lateral sensors, and shape the commanded input signals in such a way that disturbing dynamics are not excited. Scanner coupling between the lateral and out-of-plane directions is exploited and used to build a minimal model of the scanner that is also sufficient to describe the nature of the distorting resonances. This model informs the design of an online input shaper used to suppress spectral components of the high speed command signals. The method presented is distinct from alternative approaches in that neither an information-complete system identification experiment nor microscope modification are required. Because the system identification is performed online immediately before imaging, no tradeoff of performance is required. This approach has enabled an increase in the scan rates of unmodified commercial AFMs from 1-4 lines s -1 to over

Reversible electrochemical modification of the surface of a semiconductor by an atomic-force microscope probe

Energy Technology Data Exchange (ETDEWEB)

Kozhukhov, A. S., E-mail: antonkozhukhov@yandex.ru; Sheglov, D. V.; Latyshev, A. V. [Russian Academy of Sciences, Rzhanov Institute of Semiconductor Physics, Siberian Branch (Russian Federation)

2017-04-15

A technique for reversible surface modification with an atomic-force-microscope (AFM) probe is suggested. In this method, no significant mechanical or topographic changes occur upon a local variation in the surface potential of a sample under the AFM probe. The method allows a controlled relative change in the ohmic resistance of a channel in a Hall bridge within the range 20–25%.

Shear force distance control in a scanning near-field optical microscope: in resonance excitation of the fiber probe versus out of resonance excitation

International Nuclear Information System (INIS)

Lapshin, D.A.; Letokhov, V.S.; Shubeita, G.T.; Sekatskii, S.K.; Dietler, G.

2004-01-01

The experimental results of the direct measurement of the absolute value of interaction force between the fiber probe of a scanning near-field optical microscope (SNOM) operated in shear force mode and a sample, which were performed using combined SNOM-atomic force microscope setup, are discussed for the out-of-resonance fiber probe excitation mode. We demonstrate that the value of the tapping component of the total force for this mode at typical dither amplitudes is of the order of 10 nN and thus is quite comparable with the value of this force for in resonance fiber probe excitation mode. It is also shown that for all modes this force component is essentially smaller than the usually neglected static attraction force, which is of the order of 200 nN. The true contact nature of the tip-sample interaction during the out of resonance mode is proven. From this, we conclude that such a detection mode is very promising for operation in liquids, where other modes encounter great difficulties

Nanoscale imaging of the growth and division of bacterial cells on planar substrates with the atomic force microscope

Energy Technology Data Exchange (ETDEWEB)

Van Der Hofstadt, M. [Institut de Bioenginyeria de Catalunya (IBEC), C/ Baldiri i Reixac 11-15, 08028 Barcelona (Spain); Hüttener, M.; Juárez, A. [Institut de Bioenginyeria de Catalunya (IBEC), C/ Baldiri i Reixac 11-15, 08028 Barcelona (Spain); Departament de Microbiologia, Universitat de Barcelona, Avinguda Diagonal 645, 08028 Barcelona (Spain); Gomila, G., E-mail: ggomila@ibecbarcelona.eu [Institut de Bioenginyeria de Catalunya (IBEC), C/ Baldiri i Reixac 11-15, 08028 Barcelona (Spain); Departament d' Electronica, Universitat de Barcelona, C/ Marti i Franqués 1, 08028 Barcelona (Spain)

2015-07-15

With the use of the atomic force microscope (AFM), the Nanomicrobiology field has advanced drastically. Due to the complexity of imaging living bacterial processes in their natural growing environments, improvements have come to a standstill. Here we show the in situ nanoscale imaging of the growth and division of single bacterial cells on planar substrates with the atomic force microscope. To achieve this, we minimized the lateral shear forces responsible for the detachment of weakly adsorbed bacteria on planar substrates with the use of the so called dynamic jumping mode with very soft cantilever probes. With this approach, gentle imaging conditions can be maintained for long periods of time, enabling the continuous imaging of the bacterial cell growth and division, even on planar substrates. Present results offer the possibility to observe living processes of untrapped bacteria weakly attached to planar substrates. - Highlights: • Gelatine coatings used to weakly attach bacterial cells onto planar substrates. • Use of the dynamic jumping mode as a non-perturbing bacterial imaging mode. • Nanoscale resolution imaging of unperturbed single living bacterial cells. • Growth and division of single bacteria cells on planar substrates observed.

Investigation of specific interactions between T7 promoter and T7 RNA polymerase by force spectroscopy using atomic force microscope.

Science.gov (United States)

Zhang, Xiaojuan; Yao, Zhixuan; Duan, Yanting; Zhang, Xiaomei; Shi, Jinsong; Xu, Zhenghong

2018-01-11

The specific recognition and binding of promoter and RNA polymerase is the first step of transcription initiation in bacteria and largely determines transcription activity. Therefore, direct analysis of the interaction between promoter and RNA polymerase in vitro may be a new strategy for promoter characterization, to avoid interference due to the cell's biophysical condition and other regulatory elements. In the present study, the specific interaction between T7 promoter and T7 RNA polymerase was studied as a model system using force spectroscopy based on atomic force microscope (AFM). The specific interaction between T7 promoter and T7 RNA polymerase was verified by control experiments, and the rupture force in this system was measured as 307.2 ± 6.7 pN. The binding between T7 promoter mutants with various promoter activities and T7 RNA polymerase was analyzed. Interaction information including rupture force, rupture distance and binding percentage were obtained in vitro , and reporter gene expression regulated by these promoters was also measured according to a traditional promoter activity characterization method in vivo Using correlation analysis, it was found that the promoter strength characterized by reporter gene expression was closely correlated with rupture force and the binding percentage by force spectroscopy. These results indicated that the analysis of the interaction between promoter and RNA polymerase using AFM-based force spectroscopy was an effective and valid approach for the quantitative characterization of promoters. © 2018 The Author(s). Published by Portland Press Limited on behalf of the Biochemical Society.

Morphological changes in textile fibres exposed to environmental stresses: atomic force microscopic examination.

Science.gov (United States)

Canetta, Elisabetta; Montiel, Kimberley; Adya, Ashok K

2009-10-30

The ability of the atomic force microscope (AFM) to investigate the nanoscopic morphological changes in the surfaces of fabrics was examined for the first time. This study focussed on two natural (cotton and wool), and a regenerated cellulose (viscose) textile fibres exposed to various environmental stresses for different lengths of times. Analyses of the AFM images allowed us to measure quantitatively the surface texture parameters of the environmentally stressed fabrics as a function of the exposure time. It was also possible to visualise at the nanoscale the finest details of the surfaces of three weathered fabrics and clearly distinguish between the detrimental effects of the imposed environmental conditions. This study confirmed that the AFM could become a very powerful tool in forensic examination of textile fibres to provide significant fibre evidence due to its capability of distinguishing between different environmental exposures or forced damages to fibres.

Development and applications of the positron microscope

International Nuclear Information System (INIS)

1991-01-01

Progress on the positron microscope during the past year has been steady, and we currently project that initial microscope images can be collected during mid to late summer of 1992. Work during the year has mainly been divided among four areas of effort: hardware construction; power supply and control system development; radioactive source fabrication; and planning of initial experimental projects. Details of progress in these areas will be given below. An initial optical design of the microscope was completed during 1990, but during the past year, significant improvements have been made to this design, and several limiting cases of microscope performance have been evaluated. The results of these evaluations have been extremely encouraging, giving us strong indications that the optical performance of the microscope will be better than originally anticipated. In particular, we should be able to explore ultimate performance capabilities of positron microscopy using our currently planned optical system, with improvements only in the image detector system, and the positron-source/moderator configuration. We should be able to study imaging reemission microscopy with resolutions approaching 10 Angstrom and be able to produce beam spots for rastered microscope work with diameters below the 1000 Angstrom diffusion limit. Because of these exciting new possibilities, we have decided to upgrade several microscope subsystems to levels consistent with ultimate performance earlier in our construction schedule than we had previously intended. In particular, alignment facilities in the optical system, vibration isolation, and power supply and control system flexibility have all been upgraded in their design over the past year

Development of the Atomic-Resolution Environmental Transmission Electron Microscope

DEFF Research Database (Denmark)

Gai, Pratibha L.; Boyes, Edward D.; Yoshida, Kenta

2016-01-01

The development of the novel atomic-resolution environmental transmission electron microscope (atomic-resolution ETEM) for directly probing dynamic gas–solid reactions in situ at the atomic level under controlled reaction conditions consisting of gas environment and elevated temperatures is descr......The development of the novel atomic-resolution environmental transmission electron microscope (atomic-resolution ETEM) for directly probing dynamic gas–solid reactions in situ at the atomic level under controlled reaction conditions consisting of gas environment and elevated temperatures...... is used to study steels, graphene, nanowires, etc. In this chapter, the experimental setup of the microscope column and its peripherals are described....

Improved social force model based on exit selection for microscopic pedestrian simulation in subway station

Institute of Scientific and Technical Information of China (English)

郑勋; 李海鹰; 孟令云; 许心越; 陈旭

2015-01-01

An improved social force model based on exit selection is proposed to simulate pedestrians’ microscopic behaviors in subway station. The modification lies in considering three factors of spatial distance, occupant density and exit width. In addition, the problem of pedestrians selecting exit frequently is solved as follows: not changing to other exits in the affected area of one exit, using the probability of remaining preceding exit and invoking function of exit selection after several simulation steps. Pedestrians in subway station have some special characteristics, such as explicit destinations, different familiarities with subway station. Finally, Beijing Zoo Subway Station is taken as an example and the feasibility of the model results is verified through the comparison of the actual data and simulation data. The simulation results show that the improved model can depict the microscopic behaviors of pedestrians in subway station.

A universal fluid cell for the imaging of biological specimens in the atomic force microscope.

Science.gov (United States)

Kasas, Sandor; Radotic, Ksenja; Longo, Giovanni; Saha, Bashkar; Alonso-Sarduy, Livan; Dietler, Giovanni; Roduit, Charles

2013-04-01

Recently, atomic force microscope (AFM) manufacturers have begun producing instruments specifically designed to image biological specimens. In most instances, they are integrated with an inverted optical microscope, which permits concurrent optical and AFM imaging. An important component of the set-up is the imaging chamber, whose design determines the nature of the experiments that can be conducted. Many different imaging chamber designs are available, usually designed to optimize a single parameter, such as the dimensions of the substrate or the volume of fluid that can be used throughout the experiment. In this report, we present a universal fluid cell, which simultaneously optimizes all of the parameters that are important for the imaging of biological specimens in the AFM. This novel imaging chamber has been successfully tested using mammalian, plant, and microbial cells. Copyright © 2013 Wiley Periodicals, Inc.

A Student-Built Scanning Tunneling Microscope

Science.gov (United States)

Ekkens, Tom

2015-01-01

Many introductory and nanotechnology textbooks discuss the operation of various microscopes including atomic force (AFM), scanning tunneling (STM), and scanning electron microscopes (SEM). In a nanotechnology laboratory class, students frequently utilize microscopes to obtain data without a thought about the detailed operation of the tool itself.…

Mechanically stable tuning fork sensor with high quality factor for the atomic force microscope.

Science.gov (United States)

Kim, Kwangyoon; Park, Jun-Young; Kim, K B; Lee, Naesung; Seo, Yongho

2014-01-01

A quartz tuning fork was used instead of cantilever as a force sensor for the atomic force microscope. A tungsten tip was made by electrochemical etching from a wire of 50 µm diameter. In order to have mechanical stability of the tuning fork, it was attached on an alumina plate. The tungsten tip was attached on the inside end of a prong of a tuning fork. The phase shift was used as a feedback signal to control the distance between the tip and sample, and the amplitude was kept constant using a lock-in amplifier and a homemade automatic gain controller. Due to the mechanical stability, the sensor shows a high quality factor (∼10(3)), and the image quality obtained with this sensor was equivalent to that of the cantilever-based AFM. © 2014 Wiley Periodicals, Inc.

Atomic force microscope adhesion measurements and atomistic molecular dynamics simulations at different humidities

International Nuclear Information System (INIS)

Seppä, Jeremias; Sairanen, Hannu; Korpelainen, Virpi; Husu, Hannu; Heinonen, Martti; Lassila, Antti; Reischl, Bernhard; Raiteri, Paolo; Rohl, Andrew L; Nordlund, Kai

2017-01-01

Due to their operation principle atomic force microscopes (AFMs) are sensitive to all factors affecting the detected force between the probe and the sample. Relative humidity is an important and often neglected—both in experiments and simulations—factor in the interaction force between AFM probe and sample in air. This paper describes the humidity control system designed and built for the interferometrically traceable metrology AFM (IT-MAFM) at VTT MIKES. The humidity control is based on circulating the air of the AFM enclosure via dryer and humidifier paths with adjustable flow and mixing ratio of dry and humid air. The design humidity range of the system is 20–60 %rh. Force–distance adhesion studies at humidity levels between 25 %rh and 53 %rh are presented and compared to an atomistic molecular dynamics (MD) simulation. The uncertainty level of the thermal noise method implementation used for force constant calibration of the AFM cantilevers is 10 %, being the dominant component of the interaction force measurement uncertainty. Comparing the simulation and the experiment, the primary uncertainties are related to the nominally 7 nm radius and shape of measurement probe apex, possible wear and contamination, and the atomistic simulation technique details. The interaction forces are of the same order of magnitude in simulation and measurement (5 nN). An elongation of a few nanometres of the water meniscus between probe tip and sample, before its rupture, is seen in simulation upon retraction of the tip in higher humidity. This behaviour is also supported by the presented experimental measurement data but the data is insufficient to conclusively verify the quantitative meniscus elongation. (paper)

Track sensitivity and the surface roughness measurements of CR-39 with atomic force microscope

CERN Document Server

Yasuda, N; Amemiya, K; Takahashi, H; Kyan, A; Ogura, K

1999-01-01

Atomic Force Microscope (AFM) has been applied to evaluate the surface roughness and the track sensitivity of CR-39 track detector. We experimentally confirmed the inverse correlation between the track sensitivity and the roughness of the detector surface after etching. The surface of CR-39 (CR-39 doped with antioxidant (HARZLAS (TD-1)) and copolymer of CR-39/NIPAAm (TNF-1)) with high sensitivity becomes rough by the etching, while the pure CR-39 (BARYOTRAK) with low sensitivity keeps its original surface clarity even for the long etching.

Development of Scanning Ultrafast Electron Microscope Capability.

Energy Technology Data Exchange (ETDEWEB)

Collins, Kimberlee Chiyoko [Sandia National Lab. (SNL-CA), Livermore, CA (United States); Talin, Albert Alec [Sandia National Lab. (SNL-CA), Livermore, CA (United States); Chandler, David W. [Sandia National Lab. (SNL-CA), Livermore, CA (United States); Michael, Joseph R. [Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)

2016-11-01

Modern semiconductor devices rely on the transport of minority charge carriers. Direct examination of minority carrier lifetimes in real devices with nanometer-scale features requires a measurement method with simultaneously high spatial and temporal resolutions. Achieving nanometer spatial resolutions at sub-nanosecond temporal resolution is possible with pump-probe methods that utilize electrons as probes. Recently, a stroboscopic scanning electron microscope was developed at Caltech, and used to study carrier transport across a Si p-n junction [ 1 , 2 , 3 ] . In this report, we detail our development of a prototype scanning ultrafast electron microscope system at Sandia National Laboratories based on the original Caltech design. This effort represents Sandia's first exploration into ultrafast electron microscopy.

Simultaneous topography imaging and broadband nanomechanical mapping on atomic force microscope

Science.gov (United States)

Li, Tianwei; Zou, Qingze

2017-12-01

In this paper, an approach is proposed to achieve simultaneous imaging and broadband nanomechanical mapping of soft materials in air by using an atomic force microscope. Simultaneous imaging and nanomechanical mapping are needed, for example, to correlate the morphological and mechanical evolutions of the sample during dynamic phenomena such as the cell endocytosis process. Current techniques for nanomechanical mapping, however, are only capable of capturing static elasticity of the material, or the material viscoelasticity in a narrow frequency band around the resonant frequency(ies) of the cantilever used, not competent for broadband nanomechanical mapping, nor acquiring topography image of the sample simultaneously. These limitations are addressed in this work by enabling the augmentation of an excitation force stimuli of rich frequency spectrum for nanomechanical mapping in the imaging process. Kalman-filtering technique is exploited to decouple and split the mixed signals for imaging and mapping, respectively. Then the sample indentation generated is quantified online via a system-inversion method, and the effects of the indentation generated and the topography tracking error on the topography quantification are taken into account. Moreover, a data-driven feedforward-feedback control is utilized to track the sample topography. The proposed approach is illustrated through experimental implementation on a polydimethylsiloxane sample with a pre-fabricated pattern.

Development of a quartz tuning-fork-based force sensor for measurements in the tens of nanoNewton force range during nanomanipulation experiments

Energy Technology Data Exchange (ETDEWEB)

Oiko, V. T. A., E-mail: oiko@ifi.unicamp.br; Rodrigues, V.; Ugarte, D. [Instituto de Física “Gleb Wataghin,” Univ. Estadual de Campinas (UNICAMP), Campinas 13083-859 (Brazil); Martins, B. V. C. [Department of Physics, University of Alberta, Edmonton, Alberta T6G 2R3 (Canada); Silva, P. C. [Laboratório Nacional de Nanotecnologia, CNPEM, Campinas 13083-970 (Brazil)

2014-03-15

Understanding the mechanical properties of nanoscale systems requires new experimental and theoretical tools. In particular, force sensors compatible with nanomechanical testing experiments and with sensitivity in the nN range are required. Here, we report the development and testing of a tuning-fork-based force sensor for in situ nanomanipulation experiments inside a scanning electron microscope. The sensor uses a very simple design for the electronics and it allows the direct and quantitative force measurement in the 1–100 nN force range. The sensor response is initially calibrated against a nN range force standard, as, for example, a calibrated Atomic Force Microscopy cantilever; subsequently, applied force values can be directly derived using only the electric signals generated by the tuning fork. Using a homemade nanomanipulator, the quantitative force sensor has been used to analyze the mechanical deformation of multi-walled carbon nanotube bundles, where we analyzed forces in the 5–40 nN range, measured with an error bar of a few nN.

X-ray holographic microscopy using the atomic-force microscope

International Nuclear Information System (INIS)

Howells, M.R.; Jacobsen, C.J.; Lindaas, S.

1993-09-01

The present authors have been seeking for some time to improve the resolution of holographic microscopy and have engaged in a continuing series of experiments using the X1A soft x-ray undulator beam line at Brookhaven. The principle strategy for pushing the resolution lower in these experiments has been the use of polymer resists as x-ray detectors and the primary goal has been to develop the technique to become useful for examining wet biological material. In the present paper the authors report on progress in the use of resist for high-spatial-resolution x-ray detection. This is the key step in in-line holography and the one which sets the ultimate limit to the image resolution. The actual recording has always been quite easy, given a high-brightness undulator source, but the difficult step was the readout of the recorded pattern. The authors describe in what follows how they have built a special instrument: an atomic force microscope (AFM) to read holograms recorded in resist. They report the technical reasons for building, rather than buying, such an instrument and they give details of the design and performance of the device. The authors also describe the first attempts to use the system for real holography and the authors show results of both recorded holograms and the corresponding reconstructed images. Finally, the authors try to analyze the effect that these advances are likely to have on the future prospects for success in applications of x-ray holography and the degree to which the other technical systems that are needed for such success are available or within reach

Development of a transmission positron microscope

Energy Technology Data Exchange (ETDEWEB)

Matsuya, M., E-mail: matsuya@jeol.co.jp [JEOL Ltd., 1-2 Musashino, 3-Chome, Akishima, Tokyo 196-8558 (Japan); Jinno, S. [Department of Applied Chemistry, Chiba University, Yayoi, Inage, Chiba, Chiba 263-8552 (Japan); Ootsuka, T.; Inoue, M. [JEOL Ltd., 1-2 Musashino, 3-Chome, Akishima, Tokyo 196-8558 (Japan); Kurihara, T. [High Energy Accelerator Research Organization, Oho, Tsukuba, Ibaraki 305-0801 (Japan); Doyama, M.; Inoue, M. [Teikyo University of Science and Technology, Uenohara, Yamanashi 409-0913 (Japan); Fujinami, M. [Department of Applied Chemistry, Chiba University, Yayoi, Inage, Chiba, Chiba 263-8552 (Japan)

2011-07-21

A practical transmission positron microscope (TPM) JEM-1011B has been developed to survey differences in the interaction of positron and electron beams with materials, and is installed in the Slow Positron Facility of High Energy Accelerator Research Organization (KEK). The TPM can share positron and electron beams, and can also be used as a transmission electron microscope (TEM). Positron transmission images up to magnification 10,000x (resolution: 50 nm) and positron diffraction patterns up to 044 family were successfully obtained by the TPM comparing them with those of electrons. The differences in material transmittances for both beams have been measured, and can be explained by the calculated results of the Monte Carlo simulation code PENELOPE-2008.

Development of an ultrasound microscope combined with optical microscope for multiparametric characterization of a single cell.

Science.gov (United States)

Arakawa, Mototaka; Shikama, Joe; Yoshida, Koki; Nagaoka, Ryo; Kobayashi, Kazuto; Saijo, Yoshifumi

2015-09-01

Biomechanics of the cell has been gathering much attention because it affects the pathological status in atherosclerosis and cancer. In the present study, an ultrasound microscope system combined with optical microscope for characterization of a single cell with multiple ultrasound parameters was developed. The central frequency of the transducer was 375 MHz and the scan area was 80 × 80 μm with up to 200 × 200 sampling points. An inverted optical microscope was incorporated in the design of the system, allowing for simultaneous optical observations of cultured cells. Two-dimensional mapping of multiple ultrasound parameters, such as sound speed, attenuation, and acoustic impedance, as well as the thickness, density, and bulk modulus of specimen/cell under investigation, etc., was realized by the system. Sound speed and thickness of a 3T3-L1 fibroblast cell were successfully obtained by the system. The ultrasound microscope system combined with optical microscope further enhances our understanding of cellular biomechanics.

Atomic force and optical near-field microscopic investigations of polarization holographic gratings in a liquid crystalline azobenzene side-chain polyester

DEFF Research Database (Denmark)

Ramanujam, P.S.; Holme, N.C.R.; Hvilsted, S.

1996-01-01

Atomic force and scanning near-field optical microscopic investigations have been carried out on a polarization holographic grating recorded in an azobenzene side-chain Liquid crystalline polyester. It has been found that immediately following laser irradiation, a topographic surface grating...

Bringing light into the nano-world: What can you do with an atomic force microscope on top of your synchrotron radiation sample holder?

International Nuclear Information System (INIS)

Rodrigues, Mario Manuel Silveira

2009-01-01

This thesis had as a major objective to combine scanning probe microscopy in particular, atomic force microscopy with synchrotron light spectroscopies. The combination of these two types of spectroscopies is meant to be in-situ and in real time. Thus this thesis aimed at introducing new types of experimental techniques suitable for the investigation of nano-sized materials. The proposed new instrumentation, would provide chemical-specific contrast at unprecedented lateral resolution of up to 10-40 nanometers, thus overcoming existing limitations of the two families of spectroscopy methods and opening a wide range of research opportunities and challenges. For the purpose of combining these techniques an atomic force microscope was developed. The atomic force microscope (AFM) was developed around a quartz tuning fork crystal which was used as the sensor with which atomic forces are detected. The developed AFM was then used in several beam lines with essentially two different purposes. A first goal was to do spectroscopy, such as the measurement of an absorption edge, locally with the tip of the AFM. Such measurements were indeed done, but the lateral resolution is still dominated by the X-ray beam size rather than by the tip apex shape. The AFM tip was also used to measure Bragg peaks from crystals with sizes on the nanometer scale. A second goal was to use the AFM as an instrument to mechanical interact with nano-sized systems while the X-ray beam was used to probe changes in the lattice parameter of the studied systems. Thus the AFM tip was used to elastically indent a SiGe crystal while diffraction was simultaneously measured. It was possible to observe shifts of the Bragg peak as a consequence of the applied pressure. The in-situ combination of AFM with synchrotron light permitted, in this way, to measure the Young modulus of a crystal at the nano-scale without any kind of adjustable parameter. (author)

Structural analysis of radiation-induced chromosome aberrations by atomic force microscope (AFM) before and after Giemsa staining

International Nuclear Information System (INIS)

Murakami, M.; Kanda, R.; Minamihisamatsu, M.; Hayata, I.

2003-01-01

Full text: We have studied structures of chromosome aberration induced by ionizing radiation by an atomic force microscope (AFM). The AFM could visualize the fine structure of chromosomes on Giemsa stained or unstained samples, although it was difficult to visualize unstained chromosomes by light microscope. The height data of chromosomes obtained by AFM provided useful information to describe detailed structure of chromatid gaps induced by heavy ion irradiation. A fibrous structure was observed on the unstained chromosome and these structures were considered to be the 30nm fibers on the chromosome. These types of structures were observed in the gaps as well as on surface of the chromosome. Further more, other types of chromosome aberration induced by ionizing radiation visualized by AFM will be presented

Reconstruction of the Tip-Surface Interaction Potential by Analysis of the Brownian Motion of an Atomic Force Microscope Tip

NARCIS (Netherlands)

Willemsen, O.H.; Kuipers, L.; van der Werf, Kees; de Grooth, B.G.; Greve, Jan

2000-01-01

The thermal movement of an atomic force microscope (AFM) tip is used to reconstruct the tip-surface interaction potential. If a tip is brought into the vicinity of a surface, its movement is governed by the sum of the harmonic cantilever potential and the tip-surface interaction potential. By

A compact atomic force-scanning tunneling microscope for studying microelectronics and environmental aerosols

International Nuclear Information System (INIS)

Chen, G.

1996-06-01

This dissertation describes the characteristics and the construction of a compact atomic force/scanning tunneling microscope (AFM/STM). The basics and the method of preparing a tunneling junction between a chemically etched tunneling tip and a micro-manufactured cantilever is outlined by analyzing the forces between tunneling tip and cantilever as well as between force-sensing tip and sample surfaces. To our best knowledge this instrument is the first one using a commercial cantilever with only one piezoelectric tube carrying the whole tunneling sensor. The feedback control system has been optimized after a careful analysis of the electronic loop characteristics. The mode of operation has been determined by analyzing the dynamic characteristics of the scan heads and by investigating the time characteristics of the data acquisition system. The vibration isolation system has been calibrated by analyzing the characteristics of the damping setup and the stiffness of the scan head. The calculated results agree well with the measured ones. Also, a software package for data acquisition and real time display as well as for image processing and three-dimensional visualization has been developed. With this home-made software package, the images can be processed by means of a convolution filter, a Wiener filter and other 2-D FFT filters, and can be displayed in different ways. Atomic resolution images of highly oriented pyrolytic graphite (HOPG) and graphite surfaces have been obtained in AFM and STM mode. New theoretical explanations have been given for the observed anomalous STM and AFM images of graphite by calculating the asymmetric distribution of quantum conductance and tip-surface forces on a graphite surface. This not only resolved the theoretical puzzles of STM and AFM of graphite, but also revealed the relation between atomic force microscopy and scanning tunneling microscopy of graphite. Applications of STM and AFM to micro-electronic devices have been investigated

In situ measurement of the kinetic friction of ZnO nanowires inside a scanning electron microscope

Energy Technology Data Exchange (ETDEWEB)

Polyakov, Boris, E-mail: boriss.polakovs@ut.ee [Institute of Physics, University of Tartu, Riia st. 142, Tartu (Estonia); Institute of Solid State Physics, University of Latvia, Kengaraga st. 8, Riga (Latvia); Dorogin, Leonid M; Lohmus, Ants [Institute of Physics, University of Tartu, Riia st. 142, Tartu (Estonia); Romanov, Alexey E [Institute of Physics, University of Tartu, Riia st. 142, Tartu (Estonia); Ioffe Physical Technical Institute, RAS, Politehnicheskaja st. 26, St. Petersburg (Russian Federation); Lohmus, Rynno [Institute of Physics, University of Tartu, Riia st. 142, Tartu (Estonia)

2012-01-15

A novel method for measuring the kinetic friction force in situ was developed for zinc oxide nanowires on highly oriented pyrolytic graphite and oxidised silicon wafers. The experiments were performed inside a scanning electron microscope and used a nanomanipulation device as an actuator, which also had an atomic force microscope tip attached to it as a probe. A simple model based on the Timoshenko elastic beam theory was applied to interpret the elastic deformation of a sliding nanowire (NW) and to determine the distributed kinetic friction force.

Microscopic structure of superdeformed states in Th, U, Pu and Cm isotopes with Gogny force

International Nuclear Information System (INIS)

Girod, M.; Delaroche, J.P.; Romain, P.; Libert, J.

2002-01-01

The structure properties of the even-even nuclei 226, 228, 230, 232, 234 Th, 230, 232, 234, 236, 238, 240 U, 240, 242, 244, 246 Pu, and 242, 244, 246, 248 Cm have been investigated at normal and superdeformed shapes in microscopic mean-field calculations based on Gogny force. Collective levels are predicted from constrained Hartree-Fock-Bogoliubov and configuration mixing calculations. Two quasiparticle states are also predicted from blocking calculations for neutron and proton configurations. Predictions are shown and compared with experimental data at superdeformed shapes. (orig.)

Development of confocal laser microscope system for examination of microscopic characteristics of radiophotoluminescence glass dosemeters

International Nuclear Information System (INIS)

Maki, D.; Ishii, T.; Sato, F.; Kato, Y.; Yamamoto, T.; Iida, T.

2011-01-01

A confocal laser microscope system was developed for the measurement of radiophotoluminescence (RPL) photons emitted from a minute alpha-ray-irradiated area in an RPL glass dosemeter. The system was composed mainly of an inverted-type microscope, an ultraviolet laser, an XY movable stage and photon-counting circuits. The photon-counting circuits were effective in the reduction of the background noise level in the measurement of RPL photons. The performance of this microscope system was examined by the observation of standard RPL glass samples irradiated using 241 Am alpha rays. The spatial resolution of this system was ∼3 μm, and with regard to the sensitivity of this system, a hit of more than four to five alpha rays in unit area produced enough amount of RPL photons to construct the image. (authors)

Development of confocal laser microscope system for examination of microscopic characteristics of radiophotoluminescence glass dosemeters.

Science.gov (United States)

Maki, Daisuke; Ishii, Tetsuya; Sato, Fuminobu; Kato, Yushi; Yamamoto, Takayoshi; Iida, Toshiyuki

2011-03-01

A confocal laser microscope system was developed for the measurement of radiophotoluminescence (RPL) photons emitted from a minute alpha-ray-irradiated area in an RPL glass dosemeter. The system was composed mainly of an inverted-type microscope, an ultraviolet laser, an XY movable stage and photon-counting circuits. The photon-counting circuits were effective in the reduction of the background noise level in the measurement of RPL photons. The performance of this microscope system was examined by the observation of standard RPL glass samples irradiated using (241)Am alpha rays. The spatial resolution of this system was ∼ 3 μm, and with regard to the sensitivity of this system, a hit of more than four to five alpha rays in unit area produced enough amount of RPL photons to construct the image.

Development of superconducting cryo-electron microscope and its applications

International Nuclear Information System (INIS)

Iwatsuki, Masashi

1988-01-01

Recently, a superconducting cryo-electron microscope in which specimens are cooled to the liquid helium temperature (4.2 K) has been developed. The main components and functional features of this new microscope are reported together with application data on polyethylene, poly (4-methyl-1-pentene), valonia cellulose, rock salt, ice crystallites and ceramic superconductor. The resistance to electron radiation damage, of beam-sensitive specimens including polymers has been increased more than ten times. Thus, the microscope has made it possible to take high resolution images and to analyze the crystal-structure of micro-areas. (orig.) [de

Design and development of compact multiphoton microscopes

Science.gov (United States)

Mehravar, SeyedSoroush

A compact multi-photon microscope (MPM) was designed and developed with the use of low-cost mode-locked fiber lasers operating at 1040nm and 1560nm. The MPM was assembled in-house and the system aberration was investigated using the optical design software: Zemax. A novel characterization methodology based on 'nonlinear knife-edge' technique was also introduced to measure the axial, lateral resolution, and the field curvature of the multi-photon microscope's image plane. The field curvature was then post-corrected using data processing in MATLAB. A customized laser scanning software based on LabVIEW was developed for data acquisition, image display and controlling peripheral electronics. Finally, different modalities of multi-photon excitation such as second- and third harmonic generation, two- and three-photon fluorescence were utilized to study a wide variety of samples from cancerous cells to 2D-layered materials.

Atomic force microscopic study of the effects of ethanol on yeast cell surface morphology.

Science.gov (United States)

Canetta, Elisabetta; Adya, Ashok K; Walker, Graeme M

2006-02-01

The detrimental effects of ethanol toxicity on the cell surface morphology of Saccharomyces cerevisiae (strain NCYC 1681) and Schizosaccharomyces pombe (strain DVPB 1354) were investigated using an atomic force microscope (AFM). In combination with culture viability and mean cell volume measurements AFM studies allowed us to relate the cell surface morphological changes, observed on nanometer lateral resolution, with the cellular stress physiology. Exposing yeasts to increasing stressful concentrations of ethanol led to decreased cell viabilities and mean cell volumes. Together with the roughness and bearing volume analyses of the AFM images, the results provided novel insight into the relative ethanol tolerance of S. cerevisiae and Sc. pombe.

Quantitative measurements of electromechanical response with a combined optical beam and interferometric atomic force microscope

Energy Technology Data Exchange (ETDEWEB)

Labuda, Aleksander; Proksch, Roger [Asylum Research an Oxford Instruments Company, Santa Barbara, California 93117 (United States)

2015-06-22

An ongoing challenge in atomic force microscope (AFM) experiments is the quantitative measurement of cantilever motion. The vast majority of AFMs use the optical beam deflection (OBD) method to infer the deflection of the cantilever. The OBD method is easy to implement, has impressive noise performance, and tends to be mechanically robust. However, it represents an indirect measurement of the cantilever displacement, since it is fundamentally an angular rather than a displacement measurement. Here, we demonstrate a metrological AFM that combines an OBD sensor with a laser Doppler vibrometer (LDV) to enable accurate measurements of the cantilever velocity and displacement. The OBD/LDV AFM allows a host of quantitative measurements to be performed, including in-situ measurements of cantilever oscillation modes in piezoresponse force microscopy. As an example application, we demonstrate how this instrument can be used for accurate quantification of piezoelectric sensitivity—a longstanding goal in the electromechanical community.

Sub-Angstrom oscillation amplitude non-contact atomic force microscopy for lateral force gradient measurement

International Nuclear Information System (INIS)

Atabak, Mehrdad; Unverdi, Ozhan; Ozer, H. Ozguer; Oral, Ahmet

2009-01-01

We report the first results from novel sub-Angstrom oscillation amplitude non-contact atomic force microscopy developed for lateral force gradient measurements. Quantitative lateral force gradients between a tungsten tip and Si(1 1 1)-(7 x 7) surface can be measured using this microscope. Simultaneous lateral force gradient and scanning tunnelling microscope images of single and multi atomic steps are obtained. In our measurement, tunnel current is used as feedback. The lateral stiffness contrast has been observed to be 2.5 N/m at single atomic step, in contrast to 13 N/m at multi atomic step on Si(1 1 1) surface. We also carried out a series of lateral stiffness-distance spectroscopy. We observed lateral stiffness-distance curves exhibit sharp increase in the stiffness as the sample is approached towards the surface. We usually observed positive stiffness and sometimes going into slightly negative region.

The structure of cometary dust - first results from the MIDAS Atomic Force Microscope onboard Rosetta

Science.gov (United States)

Bentley, M. S.; Torkar, K.; Romstedt, J.

2014-12-01

A decade after launch the European Space Agency's Rosetta spacecraft has finally arrived at comet 67P/Churyumov-Gerasimenko. Unlike previous cometary missions, Rosetta is not a flyby, limited to taking a snapshot of the comet at a single heliocentric distance. Instead, Rosetta intercepted the comet prior to the onset of major activity and will chart its evolution during its perihelion passage and beyond. Such a unique mission requires a unique payload; as well as the more typical remote sensing instruments, Rosetta also carries sensors to sample in situ the gas and dust environment. One of these instruments is MIDAS, an atomic force microscope designed to collect dust and image it in three dimensions with nanometre resolution. Equipped with an array of sharp tips, four of which are magnetised to allow magnetic force microscopy, MIDAS exposes targets to the incident flux after which they are moved to the microscope for analysis. As well as extending coverage of the dust size distribution down to the finest particles, MIDAS has the unique capability to determine the shape of pristine particles - to determine, for example, if they are compact or fluffy, and to look for features which may be diagnostic of their formation environment or evolution. The magnetic mode lets MIDAS probe samples for magnetic material and to map its location if present. Having been operating almost continuously after hibernation imaging empty targets before exposure, the first exposures were performed when Rosetta entered 30 km bound orbits. The first MIDAS images and analyses of collected dust grains are presented here.

Microscopic descriptions of collective SD bands in the A=190 mass region with the Gogny force

International Nuclear Information System (INIS)

Girod, M.

1997-01-01

In the framework of microscopic models, we present two methods for describing superdeformed (SD) band properties. The first one is the cranked Hartree-Fock-Bogolyubov (HFB) method, without and with inclusion of particle number projection. The second one is the Gaussian overlap approximation to the generator coordinate method (GCM+GOA) with which we treat the five quadrupole collective coordinates. Both methods use the Gogny force. Moments of inertia and excitation energies of SD bands are calculated and compared with experimental results. (orig.). With 1 fig

High-speed atomic force microscope imaging: Adaptive multiloop mode

Science.gov (United States)

Ren, Juan; Zou, Qingze; Li, Bo; Lin, Zhiqun

2014-07-01

In this paper, an imaging mode (called the adaptive multiloop mode) of atomic force microscope (AFM) is proposed to substantially increase the speed of tapping mode (TM) imaging while preserving the advantages of TM imaging over contact mode (CM) imaging. Due to its superior image quality and less sample disturbances over CM imaging, particularly for soft materials such as polymers, TM imaging is currently the most widely used imaging technique. The speed of TM imaging, however, is substantially (over an order of magnitude) lower than that of CM imaging, becoming the major bottleneck of this technique. Increasing the speed of TM imaging is challenging as a stable probe tapping on the sample surface must be maintained to preserve the image quality, whereas the probe tapping is rather sensitive to the sample topography variation. As a result, the increase of imaging speed can quickly lead to loss of the probe-sample contact and/or annihilation of the probe tapping, resulting in image distortion and/or sample deformation. The proposed adaptive multiloop mode (AMLM) imaging overcomes these limitations of TM imaging through the following three efforts integrated together: First, it is proposed to account for the variation of the TM deflection when quantifying the sample topography; second, an inner-outer feedback control loop to regulate the TM deflection is added on top of the tapping-feedback control loop to improve the sample topography tracking; and, third, an online iterative feedforward controller is augmented to the whole control system to further enhance the topography tracking, where the next-line sample topography is predicted and utilized to reduce the tracking error. The added feedback regulation of the TM deflection ensures the probe-sample interaction force remains near the minimum for maintaining a stable probe-sample interaction. The proposed AMLM imaging is tested and demonstrated by imaging a poly(tert-butyl acrylate) sample in experiments. The

Indigenous development of scanning electron microscope

International Nuclear Information System (INIS)

Ambastha, K.P.; Chaudhari, Y.V.; Pal, Suvadip; Tikaria, Amit; Pious, Lizy; Dubey, B.P.; Chadda, V.K.

2009-01-01

Scanning electron microscope (SEM) is a precision instrument and plays very important role in scientific studies. Bhabha Atomic Research Centre has taken up the job of development of SEM indigenously. Standard and commercially available components like computer, high voltage power supply, detectors etc. shall be procured from market. Focusing and scanning coils, vacuum chamber, specimen stage, control hardware and software etc. shall be developed at BARC with the help of Indian industry. Procurement, design and fabrication of various parts of SEM are in progress. (author)

Near field plasmon and force microscopy

NARCIS (Netherlands)

de Hollander, R.B.G.; van Hulst, N.F.; Kooyman, R.P.H.

1995-01-01

A scanning plasmon near field optical microscope (SPNM) is presented which combines a conventional far field surface plasmon microscope with a stand-alone atomic force microscope (AFM). Near field plasmon and force images are recorded simultaneously both with a lateral resolution limited by the

Spin microscope based on optically detected magnetic resonance

Science.gov (United States)

Berman, Gennady P.; Chernobrod, Boris M.

2007-12-11

The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

Reduced order dynamic model for polysaccharides molecule attached to an atomic force microscope

International Nuclear Information System (INIS)

Tang Deman; Li Aiqin; Attar, Peter; Dowell, Earl H.

2004-01-01

A dynamic analysis and numerical simulation has been conducted of a polysaccharides molecular structure (a ten (10) single-α-D-glucose molecule chain) connected to a moving atomic force microscope (AFM). Sinusoidal base excitation of the AFM cantilevered beam is considered. First a linearized perturbation model is constructed for the complex polysaccharides molecular structure. Then reduced order (dynamic) models based upon a proper orthogonal decomposition (POD) technique are constructed using global modes for both the linearized perturbation model and for the full nonlinear model. The agreement between the original and reduced order models (ROM/POD) is very good even when only a few global modes are included in the ROM for either the linear case or for the nonlinear case. The computational advantage of the reduced order model is clear from the results presented

Set-up of a high-resolution 300 mK atomic force microscope in an ultra-high vacuum compatible "3He/10 T cryostat

International Nuclear Information System (INIS)

Allwörden, H. von; Ruschmeier, K.; Köhler, A.; Eelbo, T.; Schwarz, A.; Wiesendanger, R.

2016-01-01

The design of an atomic force microscope with an all-fiber interferometric detection scheme capable of atomic resolution at about 500 mK is presented. The microscope body is connected to a small pumped "3He reservoir with a base temperature of about 300 mK. The bakeable insert with the cooling stage can be moved from its measurement position inside the bore of a superconducting 10 T magnet into an ultra-high vacuum chamber, where the tip and sample can be exchanged in situ. Moreover, single atoms or molecules can be evaporated onto a cold substrate located inside the microscope. Two side chambers are equipped with standard surface preparation and surface analysis tools. The performance of the microscope at low temperatures is demonstrated by resolving single Co atoms on Mn/W(110) and by showing atomic resolution on NaCl(001).

Minimizing pulling geometry errors in atomic force microscope single molecule force spectroscopy.

Science.gov (United States)

Rivera, Monica; Lee, Whasil; Ke, Changhong; Marszalek, Piotr E; Cole, Daniel G; Clark, Robert L

2008-10-01

In atomic force microscopy-based single molecule force spectroscopy (AFM-SMFS), it is assumed that the pulling angle is negligible and that the force applied to the molecule is equivalent to the force measured by the instrument. Recent studies, however, have indicated that the pulling geometry errors can drastically alter the measured force-extension relationship of molecules. Here we describe a software-based alignment method that repositions the cantilever such that it is located directly above the molecule's substrate attachment site. By aligning the applied force with the measurement axis, the molecule is no longer undergoing combined loading, and the full force can be measured by the cantilever. Simulations and experimental results verify the ability of the alignment program to minimize pulling geometry errors in AFM-SMFS studies.

Development of a Kirkpatrick-Baez microscope with a large visual field

International Nuclear Information System (INIS)

Kodama, R.; Ikeda, N.; Kato, Y.

1995-01-01

The authors have developed an advanced Kirkpatrick-Baez (AKB) microscope to diagnose a laser-produced-plasma. The AKB microscope optics are two pairs of hyperbolical and elliptical cylindrical-mirrors to avoid a spherical aberration and field obliquity. Ray trace calculation was applied to optimize the characterization. The microscope has attained a spatial resolution of less than 3 mm at 2.5-keV x-ray in the field of 800 mm from experiments

Microscopic structure of superdeformed states in Th, U, Pu and Cm isotopes with Gogny force

Energy Technology Data Exchange (ETDEWEB)

Girod, M.; Delaroche, J.P.; Romain, P. [CEA/DIF, DPTA/SPN, Boite Postale 12, 91680 Bruyeres-le-Chatel (France); Libert, J. [Institut de Physique Nucleaire Centre National de la Recherche Scientifique-IN2P3, F-91406 Orsay (France)

2002-10-01

The structure properties of the even-even nuclei {sup 226,} {sup 228,} {sup 230,} {sup 232,} {sup 234}Th, {sup 230,} {sup 232,} {sup 234,} {sup 236,} {sup 238,} {sup 240}U, {sup 240,} {sup 242,} {sup 244,} {sup 246}Pu, and {sup 242,} {sup 244,} {sup 246,} {sup 248}Cm have been investigated at normal and superdeformed shapes in microscopic mean-field calculations based on Gogny force. Collective levels are predicted from constrained Hartree-Fock-Bogoliubov and configuration mixing calculations. Two quasiparticle states are also predicted from blocking calculations for neutron and proton configurations. Predictions are shown and compared with experimental data at superdeformed shapes. (orig.)

On the calibration of rectangular atomic force microscope cantilevers modified by particle attachment and lamination

International Nuclear Information System (INIS)

Bowen, James; Zhang, Zhibing; Adams, Michael J; Cheneler, David; Ward, Michael C L; Walliman, Dominic; Arkless, Stuart G

2010-01-01

A simple but effective method for estimating the spring constant of commercially available atomic force microscope (AFM) cantilevers is presented, based on estimating the cantilever thickness from knowledge of its length, width, resonant frequency and the presence or absence of an added mass, such as a colloid probe at the cantilever apex, or a thin film of deposited material. The spring constant of the cantilever can then be estimated using standard equations for cantilever beams. The results are compared to spring constant calibration measurements performed using reference cantilevers. Additionally, the effect of the deposition of Cr and Ti thin films onto rectangular Si cantilevers is investigated

Atomic Force Microscope Imaging of the Aggregation of Mouse Immunoglobulin G Molecules

Directory of Open Access Journals (Sweden)

Ke Xia

2003-01-01

Full Text Available Mouse immunoglobulin G (Ig G1 and the mixture of Ig G1 and Ig G2 deposited on mica were imaged with an atomic force microscope at room temperature and ambient pressure. At a concentration around 1.0mg/L, the molecules were well dispersed. 2~3 days after sample preparation, both Ig G1 and the mixture could self- assemble into different shapes and further form some types of local-ordered toroidal aggregations (monotoroidal, intercrossed toroidal, concentric toroidal, etc.. The number of monomers was not identical in the different toroidal aggregations but in a same circle, the shapes of polymer self-assembled by several monomolecules were found to be almost the same. There was difference between the aggregation behavior of Ig G1 and the mixture. The mechanism of Ig G molecule aggregation was ascribed to the “Y” shape and loops structure of Ig G molecule.

Nonlinear vibration of rectangular atomic force microscope cantilevers by considering the Hertzian contact theory

Energy Technology Data Exchange (ETDEWEB)

Sadeghi, A., E-mail: a_sadeghi@srbiau.ac.ir [Islamic Azad Univ., Dept. of Mechanical and Aerospace Engineering, Science and Research Branch, Tehran (Iran, Islamic Republic of); Zohoor, H. [Sharif Univ. of Technology, Center of Excellence in Design, Robotics and Automation, Tehran (Iran, Islamic Republic of); The Academy of Sciences if I.R. Iran (Iran, Islamic Republic of)

2010-05-15

The nonlinear flexural vibration for a rectangular atomic force microscope cantilever is investigated by using Timoshenko beam theory. In this paper, the normal and tangential tip-sample interaction forces are found from a Hertzian contact model and the effects of the contact position, normal and lateral contact stiffness, tip height, thickness of the beam, and the angle between the cantilever and the sample surface on the nonlinear frequency to linear frequency ratio are studied. The differential quadrature method is employed to solve the nonlinear differential equations of motion. The results show that softening behavior is seen for most cases and by increasing the normal contact stiffness, the frequency ratio increases for the first mode, but for the second mode, the situation is reversed. The nonlinear-frequency to linear-frequency ratio increases by increasing the Timoshenko beam parameter, but decreases by increasing the contact position for constant amplitude for the first and second modes. For the first mode, the frequency ratio decreases by increasing both of the lateral contact stiffness and the tip height, but increases by increasing the angle α between the cantilever and sample surface. (author)

Development and design of advanced two-photon microscope used in neuroscience

International Nuclear Information System (INIS)

Doronin, M S; Popov, A V

2016-01-01

This work represents the real steps to development and design advanced two-photon microscope by efforts of laboratory staff. Self-developed microscopy system provides possibility to service it and modify the structure of microscope depending on highly specialized experimental design and scientific goals. We are presenting here module-based microscopy system which provides an opportunity to looking for new applications of this setup depending on laboratories needs using with galvo and resonant scanners. (paper)

Set-up of a high-resolution 300 mK atomic force microscope in an ultra-high vacuum compatible {sup 3}He/10 T cryostat

Energy Technology Data Exchange (ETDEWEB)

Allwörden, H. von; Ruschmeier, K.; Köhler, A.; Eelbo, T.; Schwarz, A., E-mail: aschwarz@physnet.uni-hamburg.de; Wiesendanger, R. [Department of Physics, University of Hamburg, Jungiusstrasse 11, 20355 Hamburg (Germany)

2016-07-15

The design of an atomic force microscope with an all-fiber interferometric detection scheme capable of atomic resolution at about 500 mK is presented. The microscope body is connected to a small pumped {sup 3}He reservoir with a base temperature of about 300 mK. The bakeable insert with the cooling stage can be moved from its measurement position inside the bore of a superconducting 10 T magnet into an ultra-high vacuum chamber, where the tip and sample can be exchanged in situ. Moreover, single atoms or molecules can be evaporated onto a cold substrate located inside the microscope. Two side chambers are equipped with standard surface preparation and surface analysis tools. The performance of the microscope at low temperatures is demonstrated by resolving single Co atoms on Mn/W(110) and by showing atomic resolution on NaCl(001).

Direct observation of phase transition of GeSbTe thin films by Atomic Force Microscope

Energy Technology Data Exchange (ETDEWEB)

Yang Fei [National Laboratory of Solid State Microstructures and Jiangsu Provincial Key Laboratory of Photonic and Electronic Materials Sciences and Technology, School of Electronic Science and Engineering, Nanjing University, Nanjing 210093 (China); Xu Ling, E-mail: xuling@nju.edu.cn [National Laboratory of Solid State Microstructures and Jiangsu Provincial Key Laboratory of Photonic and Electronic Materials Sciences and Technology, School of Electronic Science and Engineering, Nanjing University, Nanjing 210093 (China); Zhang Rui; Geng Lei; Tong Liang; Xu Jun [National Laboratory of Solid State Microstructures and Jiangsu Provincial Key Laboratory of Photonic and Electronic Materials Sciences and Technology, School of Electronic Science and Engineering, Nanjing University, Nanjing 210093 (China); Su Weining; Yu Yao [National Laboratory of Solid State Microstructures and Department of Physics, Nanjing University, Nanjing 210093 (China); Ma Zhongyuan; Chen Kunji [National Laboratory of Solid State Microstructures and Jiangsu Provincial Key Laboratory of Photonic and Electronic Materials Sciences and Technology, School of Electronic Science and Engineering, Nanjing University, Nanjing 210093 (China)

2012-10-01

Graphical abstract: Nano-sized marks on GST thin film were fabricated using Conductive-AFM (Atomic Force Microscope). The AFM morphology images show that the marks are ablated at the center and a raised ring surrounding it. Highlights: Black-Right-Pointing-Pointer Microstructure of GeSbTe thin films was characterized by XRD and AFM. Black-Right-Pointing-Pointer Annealing and applying electrical field can induce crystallization on thin film. Black-Right-Pointing-Pointer Conductive-AFM was used to modify the surface of GeSbTe thin film. - Abstract: GeSbTe (GST) thin films were deposited on quartz substrates using electron beam evaporation system and then annealed in nitrogen atmosphere at different temperatures, ranging from 20 Degree-Sign C to 300 Degree-Sign C. X-ray diffraction (XRD) and Atomic Force microscope (AFM) measurements were used to characterize the as-deposited and post-annealed thin films. Annealing treatment was found to induce changes on microstructure, surface roughness and grain size, indicating that with the increase of annealing temperature, the amorphous GST films first changed to face-centered-cubic (fcc) phase and then the stable hexagonal (hex) phase. Meanwhile, conductive-AFM (C-AFM) was used to produce crystallized GST dots on thin films. I-V spectroscopy results show that GST films can switch from amorphous state to crystalline state at threshold voltage. After switching, I-V curve exhibits ohmic characteristic, which is usually observed in crystallized GST films. By applying repeated I-V spectroscopies on the thin films, crystallized nuclei were observed. As the times of I-V spectroscopies increases, the area of written dots increases, and the center of the mark begin to ablate. The AFM images show that the shape of marks is an ablated center with a raised ring surrounding it.

Corrosion initiation of stainless steel in HCl solution studied using electrochemical noise and in-situ atomic force microscope

International Nuclear Information System (INIS)

Li Yan; Hu Ronggang; Wang Jingrun; Huang Yongxia; Lin Changjian

2009-01-01

An in-situ atomic force microscope (AFM), optical microscope and electrochemical noise (ECN) techniques were applied to the investigation of corrosion initiations in an early stage of 1Cr18Ni9Ti stainless steel immersed in 0.5 M HCl solution. The electrochemical current noise data has been analyzed using discrete wavelet transform (DWT). For the first time, the origin of wavelet coefficients is discussed based on the correlation between the evolution of the energy distribution plot (EDP) of wavelet coefficients and topographic changes. It is found that the occurrence of initiation of metastable pitting at susceptive sites is resulted from the reductive breakdown of passive film of stainless steel in the diluted HCL solution. The coefficients d 4 -d 6 are originated from metastable pitting, d 7 represents the formation and growth of stable pitting while d 8 corresponds to the general corrosion.

Near field plasmon and force microscopy

OpenAIRE

de Hollander, R.B.G.; van Hulst, N.F.; Kooyman, R.P.H.

1995-01-01

A scanning plasmon near field optical microscope (SPNM) is presented which combines a conventional far field surface plasmon microscope with a stand-alone atomic force microscope (AFM). Near field plasmon and force images are recorded simultaneously both with a lateral resolution limited by the probe size to about 20 nm. At variance to previous work, utilizing a scanning tunneling microscope (STM) with a metallic tip, a dielectric silicon-nitride tip is used in contact mode. This arrangement ...

In situ measurements of human articular cartilage stiffness by means of a scanning force microscope

International Nuclear Information System (INIS)

Imer, Raphael; Akiyama, Terunobu; Rooij, Nico F de; Stolz, Martin; Aebi, Ueli; Kilger, Robert; Friederich, Niklaus F; Wirz, Dieter; Daniels, A U; Staufer, Urs

2007-01-01

Osteoarthritis is a painful and disabling progressive joint disease, characterized by degradation of articular cartilage. In order to study this disease at early stages, we have miniaturized and integrated a complete scanning force microscope into a standard arthroscopic device fitting through a standard orthopedic canula. This instrument will allow orthopedic surgeons to measure the mechanical properties of articular cartilage at the nanometer and micrometer scale in-vivo during a standard arthroscopy. An orthopedic surgeon assessed the handling of the instrument. First measurements of the elasticity-modulus of human cartilage were recorded in a cadaver knee non minimal invasive. Second, minimally invasive experiments were performed using arthroscopic instruments. Load-displacement curves were successfully recorded

Note: Fabrication of a fast-response and user-friendly environmental chamber for atomic force microscopes

Energy Technology Data Exchange (ETDEWEB)

Ji, Yanfeng; Hui, Fei; Shi, Yuanyuan; Han, Tingting; Song, Xiaoxue; Pan, Chengbin; Lanza, Mario, E-mail: mlanza@suda.edu.cn [Institute of Functional Nano & Soft Materials, Soochow University, Collaborative Innovation Center of Suzhou Nano Science & Technology, 199 Ren-Ai Road, Suzhou 215123 (China)

2015-10-15

The atomic force microscope is one of the most widespread tools in science, but many suppliers do not provide a competitive solution to make experiments in controlled atmospheres. Here, we provide a solution to this problem by fabricating a fast-response and user-friendly environmental chamber. We corroborate the correct functioning of the chamber by studying the formation of local anodic oxidation on a silicon sample (biased under opposite polarities), an effect that can be suppressed by measuring in a dry nitrogen atmosphere. The usefulness of this chamber goes beyond the example here presented, and it could be used in many other fields of science, including physics, mechanics, microelectronics, nanotechnology, medicine, and biology.

In situ measurements of human articular cartilage stiffness by means of a scanning force microscope

Energy Technology Data Exchange (ETDEWEB)

Imer, Raphael [Institute of Microtechnology, University of Neuchatel, Jaquet-Droz 1, 2007 Neuchatel (Switzerland); Akiyama, Terunobu [Institute of Microtechnology, University of Neuchatel, Jaquet-Droz 1, 2007 Neuchatel (Switzerland); Rooij, Nico F de [Institute of Microtechnology, University of Neuchatel, Jaquet-Droz 1, 2007 Neuchatel (Switzerland); Stolz, Martin [Maurice E. Mueller Institute, University of Basel, Klingelbergstr. 70, 4056 Basel (Switzerland); Aebi, Ueli [Maurice E. Mueller Institute, University of Basel, Klingelbergstr. 70, 4056 Basel (Switzerland); Kilger, Robert [Clinics for Orthopedic Surgery and Traumatology, Kantonsspital, 4101 Bruderholz (Switzerland); Friederich, Niklaus F [Clinics for Orthopedic Surgery and Traumatology, Kantonsspital, 4101 Bruderholz (Switzerland); Wirz, Dieter [Lab. for Orthopaedic Biomechanics, University of Basel, Klingelbergstr. 50-70, 4056 Basel (Switzerland); Daniels, A U [Lab. for Orthopaedic Biomechanics, University of Basel, Klingelbergstr. 50-70, 4056 Basel (Switzerland); Staufer, Urs [Institute of Microtechnology, University of Neuchatel, Jaquet-Droz 1, 2007 Neuchatel (Switzerland)

2007-03-15

Osteoarthritis is a painful and disabling progressive joint disease, characterized by degradation of articular cartilage. In order to study this disease at early stages, we have miniaturized and integrated a complete scanning force microscope into a standard arthroscopic device fitting through a standard orthopedic canula. This instrument will allow orthopedic surgeons to measure the mechanical properties of articular cartilage at the nanometer and micrometer scale in-vivo during a standard arthroscopy. An orthopedic surgeon assessed the handling of the instrument. First measurements of the elasticity-modulus of human cartilage were recorded in a cadaver knee non minimal invasive. Second, minimally invasive experiments were performed using arthroscopic instruments. Load-displacement curves were successfully recorded.

Lorentz force actuation of a heated atomic force microscope cantilever.

Science.gov (United States)

Lee, Byeonghee; Prater, Craig B; King, William P

2012-02-10

We report Lorentz force-induced actuation of a silicon microcantilever having an integrated resistive heater. Oscillating current through the cantilever interacts with the magnetic field around a NdFeB permanent magnet and induces a Lorentz force that deflects the cantilever. The same current induces cantilever heating. With AC currents as low as 0.2 mA, the cantilever can be oscillated as much as 80 nm at resonance with a DC temperature rise of less than 5 °C. By comparison, the AC temperature variation leads to a thermomechanical oscillation that is about 1000 times smaller than the Lorentz deflection at the cantilever resonance. The cantilever position in the nonuniform magnetic field affects the Lorentz force-induced deflection, with the magnetic field parallel to the cantilever having the largest effect on cantilever actuation. We demonstrate how the cantilever actuation can be used for imaging, and for measuring the local material softening temperature by sensing the contact resonance shift.

Real time drift measurement for colloidal probe atomic force microscope: a visual sensing approach

Energy Technology Data Exchange (ETDEWEB)

Wang, Yuliang, E-mail: wangyuliang@buaa.edu.cn; Bi, Shusheng [Robotics Institute, School of Mechanical Engineering and Automation, Beihang University, Beijing 100191 (China); Wang, Huimin [Department of Materials Science and Engineering, The Ohio State University, 2041 College Rd., Columbus, OH 43210 (United States)

2014-05-15

Drift has long been an issue in atomic force microscope (AFM) systems and limits their ability to make long time period measurements. In this study, a new method is proposed to directly measure and compensate for the drift between AFM cantilevers and sample surfaces in AFM systems. This was achieved by simultaneously measuring z positions for beads at the end of an AFM colloidal probe and on sample surface through an off-focus image processing based visual sensing method. The working principle and system configuration are presented. Experiments were conducted to validate the real time drift measurement and compensation. The implication of the proposed method for regular AFM measurements is discussed. We believe that this technique provides a practical and efficient approach for AFM experiments requiring long time period measurement.

Model Development for Atomic Force Microscope Stage Mechanisms

National Research Council Canada - National Science Library

Smith, Ralph C; Hatch, Andrew G; De, Tathagata; Salapaka, Murti V; Raye, Julie K; del Rosario, Ricardo C

2005-01-01

In this paper, we develop nonlinear constitutive equations and resulting system models quantifying the nonlinear and hysteretic field-displacement relations inherent to lead zirconate titanate (PZT...

In-Situ atomic force microscopic observation of ion beam bombarded plant cell envelopes

International Nuclear Information System (INIS)

Sangyuenyongpipat, S.; Yu, L.D.; Brown, I.G.; Seprom, C.; Vilaithong, T.

2007-01-01

A program in ion beam bioengineering has been established at Chiang Mai University (CMU), Thailand, and ion beam induced transfer of plasmid DNA molecules into bacterial cells (Escherichia coli) has been demonstrated. However, a good understanding of the fundamental physical processes involved is lacking. In parallel work, onion skin cells have been bombarded with Ar + ions at energy 25 keV and fluence1-2 x 10 15 ions/cm 2 , revealing the formation of microcrater-like structures on the cell wall that could serve as channels for the transfer of large macromolecules into the cell interior. An in-situ atomic force microscope (AFM) system has been designed and installed in the CMU bio-implantation facility as a tool for the observation of these microcraters during ion beam bombardment. Here we describe some of the features of the in-situ AFM and outline some of the related work

Modelling atomic scale manipulation with the non-contact atomic force microscope

International Nuclear Information System (INIS)

Trevethan, T; Watkins, M; Kantorovich, L N; Shluger, A L; Polesel-Maris, J; Gauthier, S

2006-01-01

We present the results of calculations performed to model the process of lateral manipulation of an oxygen vacancy in the MgO(001) surface using the non-contact atomic force microscope (NC-AFM). The potential energy surfaces for the manipulation as a function of tip position are determined from atomistic modelling of the MgO(001) surface interacting with a Mg terminated MgO tip. These energies are then used to model the dynamical evolution of the system as the tip oscillates and at a finite temperature using a kinetic Monte Carlo method. The manipulation process is strongly dependent on the lateral position of the tip and the system temperature. It is also found that the expectation value of the point at which the vacancy jumps depends on the trajectory of the oscillating cantilever as the surface is approached. The effect of the manipulation on the operation of the NC-AFM is modelled with a virtual dynamic AFM, which explicitly simulates the entire experimental instrumentation and control loops. We show how measurable experimental signals can result from a single controlled atomic scale event and suggest the most favourable conditions for achieving successful atomic scale manipulation experimentally

Microscopical descriptions of the fission fragmentation developed at CEA Bruyeres (France)

International Nuclear Information System (INIS)

Sida, J. L.

2007-01-01

The fission process has been studied from 1939 but there is no full theoretical description of the process. Two approaches have been developped at CEA Bruyeres le Chatel (France) in the basis of microscopic calculations with the Gogny Force. The first one is based on mean field calculations of the fission parameters (Potential enegy landscape, inertial parameters). The evolution of the wave function of the system is followed from the saddle point to the scission line in an adiabatic dynamical approach in order to determine the fission fragment distributions [GOU04]. The second one used the theoretical nuclear database AMEDEE (http://www-phynu.cea.fr/science_en_ligne/carte_potentiels_microscopiques/carte_potentiel_nucleaire.htm) which includes the mean field potential of more than 7000 nuclei. A precise energy balance is done at the scission point in order to define the available energy for each possible fragmentation. A statistical model is than used to determine the fragments distributions [HEI06]. This work is an improvement of the statistical scission point model of Wilkins et al [WIL76]. The free parameters of the previous description have been reduced to the minimum and there is still one parameter value that define the scission configuration which is not used ass a free parameter but has been fixed for the systematic that will be presented. This two microscopical models will be presented and the results will be discussed and compared to experiments. We will also point on their possible use to realize data evaluation for the burn-up of minor actinides, wastes of nuclear plants. (Author)

A single-cell scraper based on an atomic force microscope for detaching a living cell from a substrate

Energy Technology Data Exchange (ETDEWEB)

Iwata, Futoshi, E-mail: iwata.futoshi@shizuoka.ac.jp [Department of Mechanical Engineering, Faculty of Engineering, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8561 (Japan); Research Institute of Electronics, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8011 (Japan); Adachi, Makoto; Hashimoto, Shigetaka [Department of Mechanical Engineering, Faculty of Engineering, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8561 (Japan)

2015-10-07

We describe an atomic force microscope (AFM) manipulator that can detach a single, living adhesion cell from its substrate without compromising the cell's viability. The micrometer-scale cell scraper designed for this purpose was fabricated from an AFM micro cantilever using focused ion beam milling. The homemade AFM equipped with the scraper was compact and standalone and could be mounted on a sample stage of an inverted optical microscope. It was possible to move the scraper using selectable modes of operation, either a manual mode with a haptic device or a computer-controlled mode. The viability of the scraped single cells was evaluated using a fluorescence dye of calcein-acetoxymethl ester. Single cells detached from the substrate were collected by aspiration into a micropipette capillary glass using an electro-osmotic pump. As a demonstration, single HeLa cells were selectively detached from the substrate and collected by the micropipette. It was possible to recultivate HeLa cells from the single cells collected using the system.

Improved controlled atmosphere high temperature scanning probe microscope

DEFF Research Database (Denmark)

Hansen, Karin Vels; Wu, Yuehua; Jacobsen, Torben

2013-01-01

fuel cells and electrolyzer cells. Here, we report on advanced improvements of our original controlled atmosphere high temperature scanning probe microscope, CAHT-SPM. The new microscope can employ a broad range of the scanning probe techniques including tapping mode, scanning tunneling microscopy......, scanning tunneling spectroscopy, conductive atomic force microscopy, and Kelvin probe force microscopy. The temperature of the sample can be as high as 850 °C. Both reducing and oxidizing gases such as oxygen, hydrogen, and nitrogen can be added in the sample chamber and the oxygen partial pressure (pO2...

Uncertainty quantification in nanomechanical measurements using the atomic force microscope

International Nuclear Information System (INIS)

Wagner, Ryan; Raman, Arvind; Moon, Robert; Pratt, Jon; Shaw, Gordon

2011-01-01

Quantifying uncertainty in measured properties of nanomaterials is a prerequisite for the manufacture of reliable nanoengineered materials and products. Yet, rigorous uncertainty quantification (UQ) is rarely applied for material property measurements with the atomic force microscope (AFM), a widely used instrument that can measure properties at nanometer scale resolution of both inorganic and biological surfaces and nanomaterials. We present a framework to ascribe uncertainty to local nanomechanical properties of any nanoparticle or surface measured with the AFM by taking into account the main uncertainty sources inherent in such measurements. We demonstrate the framework by quantifying uncertainty in AFM-based measurements of the transverse elastic modulus of cellulose nanocrystals (CNCs), an abundant, plant-derived nanomaterial whose mechanical properties are comparable to Kevlar fibers. For a single, isolated CNC the transverse elastic modulus was found to have a mean of 8.1 GPa and a 95% confidence interval of 2.7–20 GPa. A key result is that multiple replicates of force–distance curves do not sample the important sources of uncertainty, which are systematic in nature. The dominant source of uncertainty is the nondimensional photodiode sensitivity calibration rather than the cantilever stiffness or Z-piezo calibrations. The results underscore the great need for, and open a path towards, quantifying and minimizing uncertainty in AFM-based material property measurements of nanoparticles, nanostructured surfaces, thin films, polymers and biomaterials.

Atomic force microscope with integrated optical microscope for biological applications

NARCIS (Netherlands)

Putman, Constant A.J.; Putman, C.A.J.; van der Werf, Kees; de Grooth, B.G.; van Hulst, N.F.; Segerink, Franciscus B.; Greve, Jan

1992-01-01

Since atomic force microscopy (AFM) is capable of imaging nonconducting surfaces, the technique holds great promises for high‐resolution imaging of biological specimens. A disadvantage of most AFMs is the fact that the relatively large sample surface has to be scanned multiple times to pinpoint a

Characterization of the photocurrents generated by the laser of atomic force microscopes

Energy Technology Data Exchange (ETDEWEB)

Ji, Yanfeng; Hui, Fei; Shi, Yuanyuan; Lanza, Mario, E-mail: mlanza@suda.edu.cn [Institute of Functional Nano and Soft Materials (FUNSOM), Collaborative Innovation Center of Suzhou Nanoscience and Technology, Soochow University, 199 Ren-Ai Road, Suzhou 215123 (China); Iglesias, Vanessa [International Iberian Nanotechnology Laboratory, 4715-330 Braga (Portugal); Lewis, David [Nanonics Imaging, Har Hotzvim, Jerusalem 91487 (Israel); Niu, Jiebin; Long, Shibing; Liu, Ming [Laboratory of Nanofabrication and Novel Device Integration, Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029 (China); Hofer, Alexander; Frammelsberger, Werner; Benstetter, Guenther [Deggendorf Institute of Technology, Edlmairstr. 6+8, 94469 Deggendorf (Germany); Scheuermann, Andrew; McIntyre, Paul C. [Department of Materials Science and Engineering, Stanford University, Stanford, California 94305 (United States)

2016-08-15

The conductive atomic force microscope (CAFM) has become an essential tool for the nanoscale electronic characterization of many materials and devices. When studying photoactive samples, the laser used by the CAFM to detect the deflection of the cantilever can generate photocurrents that perturb the current signals collected, leading to unreliable characterization. In metal-coated semiconductor samples, this problem is further aggravated, and large currents above the nanometer range can be observed even without the application of any bias. Here we present the first characterization of the photocurrents introduced by the laser of the CAFM, and we quantify the amount of light arriving to the surface of the sample. The mechanisms for current collection when placing the CAFM tip on metal-coated photoactive samples are also analyzed in-depth. Finally, we successfully avoided the laser-induced perturbations using a two pass technique: the first scan collects the topography (laser ON) and the second collects the current (laser OFF). We also demonstrate that CAFMs without a laser (using a tuning fork for detecting the deflection of the tip) do not have this problem.

Comparing the photocatalytic activity of TiO2 at macro- and microscopic scales

DEFF Research Database (Denmark)

Torras-Rosell, Antoni; Johannsen, Sabrina Rostgaard; Dirscherl, Kai

2016-01-01

. The photocatalytic properties of TiO2 at macro- and microscopic scales are investigated by comparing photocatalytic degradation of acetone and electrochemical experiments to Kelvin probe force microscopy. The good agreement between the macro- and microscopic experiments suggests that Kelvin probe force microscopy...

Microscopic investigation of InGaN/GaN heterostructure laser diode degradation using Kelvin probe force microscopy

International Nuclear Information System (INIS)

Lochthofen, A; Mertin, W; Bacher, G; Furitsch, M; Bruederl, G; Strauss, U; Haerle, V

2008-01-01

We report on Kelvin probe force microscopy (KPFM) measurements on fresh and artificially aged InGaN/GaN laser test structures. In the case of an unbiased laser diode, a comparison of the surface potential between a fresh and a stressed laser diode shows a pronounced modification of the laser facet due to the aging process. Performing KPFM measurements under forward bias, a correlation between the macroscopic I-V characteristics and the microscopic voltage drop across the heterostructure layer sequence is found. This clearly demonstrates the potential of KPFM for investigating InGaN/GaN laser diode degradation

Atomic force microscope observation of branching in single transcript molecules derived from human cardiac muscle

International Nuclear Information System (INIS)

Reed, Jason; Hsueh, Carlin; Gimzewski, James K; Mishra, Bud

2008-01-01

We have used an atomic force microscope to examine a clinically derived sample of single-molecule gene transcripts, in the form of double-stranded cDNA, (c: complementary) obtained from human cardiac muscle without the use of polymerase chain reaction (PCR) amplification. We observed a log-normal distribution of transcript sizes, with most molecules being in the range of 0.4-7.0 kilobase pairs (kb) or 130-2300 nm in contour length, in accordance with the expected distribution of mRNA (m: messenger) sizes in mammalian cells. We observed novel branching structures not previously known to exist in cDNA, and which could have profound negative effects on traditional analysis of cDNA samples through cloning, PCR and DNA sequencing

Atomic force microscope cantilever as an encoding sensor for real-time displacement measurement

International Nuclear Information System (INIS)

Chen, Xiaomei; Koenders, Ludger; Wolff, Helmut; Haertig, Frank; Schilling, Meinhard

2010-01-01

A tuning fork-based atomic force microscope cantilever has been investigated for application as an encoding sensor for real-time displacement measurement. The algorithm used to encode the displacement is based on the direct count of the integer pitches of a known grating, and the calculation of the fractional parts of a pitch at the beginning and during displacement. A cross-correlation technique has been adopted and applied to the real-time signal filtering process for the determination of the pitch during scanning by using a half sinusoidal waveform template. For the first investigation, a 1D sinusoidal grating with the pitch of 300 nm is used. The repeatability of displacement measurements over a distance of 70 µm is better than 2.2 nm. As the first application, the real-time displacement of a scanning stage is measured by the new encoding principle as it is moved in an open-loop mode and closed-loop mode based on its built-in capacitance sensor

Reconsideration of dynamic force spectroscopy analysis of streptavidin-biotin interactions.

Science.gov (United States)

Taninaka, Atsushi; Takeuchi, Osamu; Shigekawa, Hidemi

2010-05-13

To understand and design molecular functions on the basis of molecular recognition processes, the microscopic probing of the energy landscapes of individual interactions in a molecular complex and their dependence on the surrounding conditions is of great importance. Dynamic force spectroscopy (DFS) is a technique that enables us to study the interaction between molecules at the single-molecule level. However, the obtained results differ among previous studies, which is considered to be caused by the differences in the measurement conditions. We have developed an atomic force microscopy technique that enables the precise analysis of molecular interactions on the basis of DFS. After verifying the performance of this technique, we carried out measurements to determine the landscapes of streptavidin-biotin interactions. The obtained results showed good agreement with theoretical predictions. Lifetimes were also well analyzed. Using a combination of cross-linkers and the atomic force microscope that we developed, site-selective measurement was carried out, and the steps involved in bonding due to microscopic interactions are discussed using the results obtained by site-selective analysis.

Topotactic changes on η-Mo4O11 caused by biased atomic force microscope tip and cw-laser

Science.gov (United States)

Borovšak, Miloš; Šutar, Petra; Goreshnik, Evgeny; Mihailovic, Dragan

2015-11-01

We present topotactic changes on Mo4O11 crystals induced by a biased atomic force microscope tip and continuous laser. The transformation does not change the topography of the samples, while the surface potential shows remarkable changes on areas where the biased AFM tip was applied. No structural changes were observed by Raman spectroscopy, but AFM scans revealed changes to surface potential due to laser illumination. The observed phenomenon could be potentially useful for memristive memory devices considering the fact that properties of other molybdenum oxides vary from metallic to insulators.

Nanofabrication of magnetic scanned-probe microscope sensors

International Nuclear Information System (INIS)

Chong, B.K.

2001-10-01

This thesis presents the development of novel magnetic sensor combined with Atomic Force Microscope probe (AFM) using conventional semiconductor processing techniques and Electron Beam Lithography (EBL). The fabrication of these magnetic sensors was performed on a common micromachined silicon substrate using a generic batch fabrication technique. Sub-micron Hall bar for Scanning Hall probe Microscopy (SHPM) and electromagnetic force coil magnet for Scanning Electromagnetic Force Microscopy (eMFM) were designed and constructed at the apex of Silicon attractive mode cantilever probes. The process demonstrates good control over sensor parameters. Results indicated controllability of Hall bar junction sizes (spatial resolution) to below 100nm and Coil diameter sizes to below 500nm with minimum sizes down to 50nm and 270nm respectively. The process has shown its flexibility to accommodate different material systems. The same technology was used to fabricate multiple devices such as double Hall bars on a tip as well as a small electro-magnet coil probe co-defined with the Hall probe to form a magnetic imaging / modification probe. A conventional Non-Contact mode AFM employing heterodyne interferometry and in-house built electronics was modified for SHPM and eMFM. These probes had been scanned over a commercial computer hard disk. These microscopes showed the capability of resolving magnetic bits and topographic information independently and simultaneously. All scanning experiments were carried out under ambient conditions. The experiments required no extra preparation to be done to the specimen before imaging and measurements were carried out under ambient conditions. These probes offer the prospect of direct magnetic field measurement, non- invasiveness, very close proximity, possible local manipulation, better control over the tip- specimen interaction distance and topographic imaging. It is hoped that these magnetic microscope probes will be of great interest and

Focal depth measurement of scanning helium ion microscope

International Nuclear Information System (INIS)

Guo, Hongxuan; Itoh, Hiroshi; Wang, Chunmei; Zhang, Han; Fujita, Daisuke

2014-01-01

When facing the challenges of critical dimension measurement of complicated nanostructures, such as of the three dimension integrated circuit, characterization of the focal depth of microscopes is important. In this Letter, we developed a method for characterizing the focal depth of a scanning helium ion microscope (HIM) by using an atomic force microscope tip characterizer (ATC). The ATC was tilted in a sample chamber at an angle to the scanning plan. Secondary electron images (SEIs) were obtained at different positions of the ATC. The edge resolution of the SEIs shows the nominal diameters of the helium ion beam at different focal levels. With this method, the nominal shapes of the helium ion beams were obtained with different apertures. Our results show that a small aperture is necessary to get a high spatial resolution and high depth of field images with HIM. This work provides a method for characterizing and improving the performance of HIM.

Lateral resolution testing of a novel developed confocal microscopic imaging system

Science.gov (United States)

Zhang, Xin; Zhang, Yunhai; Chang, Jian; Huang, Wei; Xue, Xiaojun; Xiao, Yun

2015-10-01

Laser scanning confocal microscope has been widely used in biology, medicine and material science owing to its advantages of high resolution and tomographic imaging. Based on a set of confirmatory experiments and system design, a novel confocal microscopic imaging system is developed. The system is composed of a conventional fluorescence microscope and a confocal scanning unit. In the scanning unit a laser beam coupling module provides four different wavelengths 405nm 488nm 561nm and 638nm which can excite a variety of dyes. The system works in spot-to-spot scanning mode with a two-dimensional galvanometer. A 50 microns pinhole is used to guarantee that stray light is blocked and only the fluorescence signal from the focal point can be received . The three-channel spectral splitter is used to perform fluorescence imaging at three different working wavelengths simultaneously. The rat kidney tissue slice is imaged using the developed confocal microscopic imaging system. Nucleues labeled by DAPI and kidney spherule curved pipe labeled by Alexa Fluor 488 can be imaged clearly and respectively, realizing the distinction between the different components of mouse kidney tissue. The three-dimensional tomographic imaging of mouse kidney tissue is reconstructed by several two-dimensional images obtained in different depths. At last the resolution of the confocal microscopic imaging system is tested quantitatively. The experimental result shows that the system can achieve lateral resolution priority to 230nm.

Imaging the Microscopic Structure of Shear Thinning and Thickening Colloidal Suspensions

KAUST Repository

Cheng, X.

2011-09-01

The viscosity of colloidal suspensions varies with shear rate, an important effect encountered in many natural and industrial processes. Although this non-Newtonian behavior is believed to arise from the arrangement of suspended particles and their mutual interactions, microscopic particle dynamics are difficult to measure. By combining fast confocal microscopy with simultaneous force measurements, we systematically investigate a suspension\\'s structure as it transitions through regimes of different flow signatures. Our measurements of the microscopic single-particle dynamics show that shear thinning results from the decreased relative contribution of entropic forces and that shear thickening arises from particle clustering induced by hydrodynamic lubrication forces. This combination of techniques illustrates an approach that complements current methods for determining the microscopic origins of non-Newtonian flow behavior in complex fluids.

Mechanism of force mode dip-pen nanolithography

Energy Technology Data Exchange (ETDEWEB)

Yang, Haijun, E-mail: yanghaijun@sinap.ac.cn, E-mail: swguo@sjtu.edu.cn, E-mail: wanghuabin@cigit.ac.cn [Key Laboratory for Thin Film and Microfabrication of the Ministry of Education, Research Institute of Micro/Nano Science and Technology, Shanghai Jiao Tong University, Shanghai 200240 (China); Interfacial Water Division and Key Laboratory of Interfacial Physics and Technology, Shanghai Institute of Applied Physics, CAS, Shanghai 201800 (China); Xie, Hui; Rong, Weibin; Sun, Lining [State Key Laboratory of Robotics and Systems, Harbin Institute of Technology, Harbin 150080 (China); Wu, Haixia; Guo, Shouwu, E-mail: yanghaijun@sinap.ac.cn, E-mail: swguo@sjtu.edu.cn, E-mail: wanghuabin@cigit.ac.cn [Key Laboratory for Thin Film and Microfabrication of the Ministry of Education, Research Institute of Micro/Nano Science and Technology, Shanghai Jiao Tong University, Shanghai 200240 (China); Wang, Huabin, E-mail: yanghaijun@sinap.ac.cn, E-mail: swguo@sjtu.edu.cn, E-mail: wanghuabin@cigit.ac.cn [Centre for Tetrahertz Research, Chongqing Institute of Green and Intelligent Technology, Chinese Academy of Sciences, Chongqing 400714 (China)

2014-05-07

In this work, the underlying mechanism of the force mode dip-pen nanolithography (FMDPN) is investigated in depth by analyzing force curves, tapping mode deflection signals, and “Z-scan” voltage variations during the FMDPN. The operation parameters including the relative “trigger threshold” and “surface delay” parameters are vital to control the loading force and dwell time for ink deposition during FMDPN. A model is also developed to simulate the interactions between the atomic force microscope tip and soft substrate during FMDPN, and verified by its good performance in fitting our experimental data.

Development of a backscattering type ultraviolet apertureless near-field scanning optical microscope.

Science.gov (United States)

Kwon, Sangjin; Jeong, Hyun; Jeong, Mun Seok; Jeong, Sungho

2011-08-01

A backscattering type ultraviolet apertureless near-field scanning optical microscope (ANSOM) for the correlated measurement of topographical and optical characteristics of photonic materials with high optical resolution was developed. The near-field Rayleigh scattering image of GaN covered with periodic submicron Cr dots showed that optical resolution around 40 nm was achievable. By measuring the tip scattered photoluminescence of InGaN/GaN multi quantum wells, the applicability of the developed microscope for high resolution fluorescence measurement was also demonstrated.

Role of attractive forces in tapping tip force microscopy

DEFF Research Database (Denmark)

Kyhle, Anders; Sørensen, Alexis Hammer; Bohr, Jakob

1997-01-01

We present experimental and numerical results demonstrating the drastic influence of attractive forces on the behaviour of the atomic force microscope when operated in the resonant tapping tip mode in an ambient environment. It is often assumed that tapping is related to repulsive interaction...

Photo-assisted local oxidation of GaN using an atomic force microscope

International Nuclear Information System (INIS)

Hwang, J S; Hu, Z S; Lu, T Y; Chen, L W; Chen, S W; Lin, T Y; Hsiao, C-L; Chen, K-H; Chen, L-C

2006-01-01

This paper introduces a photo-assisted atomic force microscope (AFM) local oxidation technique which is capable of producing highly smooth oxide patterns with heights reaching several tens of nanometres on both n- and p-types of GaN (and in principle on most semiconductors) without the use of chemicals. The novel methodology relies on UV illumination of the surface of the substrate during conventional AFM local oxidation. A low 1.2 V threshold voltage for n-type GaN was obtained, which can be explained by UV photo-generation of excess electron-hole pairs in the substrate near the junction, thereby reducing the electric field required to drive carrier flow through the tip-sample Schottky barrier. It was demonstrated that the presence or absence of light alone was sufficient to switch the growth of the oxide on or off. The photo-assisted AFM oxidation technique is of immediate interest to the semiconductor industry for the fabrication of GaN-based complementary metal-oxide-semiconductor devices and nanodevices, improves chances for AFM-type data storage, and presents new degrees of freedom for process control technique

Analyzing the Effect of Capillary Force on Vibrational Performance of the Cantilever of an Atomic Force Microscope in Tapping Mode with Double Piezoelectric Layers in an Air Environment.

Science.gov (United States)

Nahavandi, Amir; Korayem, Moharam Habibnejad

2015-10-01

The aim of this paper is to determine the effects of forces exerted on the cantilever probe tip of an atomic force microscope (AFM). These forces vary according to the separation distance between the probe tip and the surface of the sample being examined. Hence, at a distance away from the surface (farther than d(on)), these forces have an attractive nature and are of Van der Waals type, and when the probe tip is situated in the range of a₀≤ d(ts) ≤ d(on), the capillary force is added to the Van der Waals force. At a distance of d(ts) ≤ a₀, the Van der Waals and capillary forces remain constant at intermolecular distances, and the contact repulsive force repels the probe tip from the surface of sample. The capillary force emerges due to the contact of thin water films with a thickness of h(c) which have accumulated on the sample and probe. Under environmental conditions a layer of water or hydrocarbon often forms between the probe tip and sample. The capillary meniscus can grow until the rate of evaporation equals the rate of condensation. For each of the above forces, different models are presented. The smoothness or roughness of the surfaces and the geometry of the cantilever tip have a significant effect on the modeling of forces applied on the probe tip. Van der Waals and the repulsive forces are considered to be the same in all the simulations, and only the capillary force is altered in order to evaluate the role of this force in the AFM-based modeling. Therefore, in view of the remarkable advantages of the piezoelectric microcantilever and also the extensive applications of the tapping mode, we investigate vibrational motion of the piezoelectric microcantilever in the tapping mode. The cantilever mentioned is entirely covered by two piezoelectric layers that carry out both the actuation of the probe tip and the measuringof its position.

Rate of force development

DEFF Research Database (Denmark)

Maffiuletti, Nicola A; Aagaard, Per; Blazevich, Anthony J

2016-01-01

The evaluation of rate of force development during rapid contractions has recently become quite popular for characterising explosive strength of athletes, elderly individuals and patients. The main aims of this narrative review are to describe the neuromuscular determinants of rate of force devel...

An in vitro atomic force microscopic study of commercially available dental luting materials.

Science.gov (United States)

Djordje, Antonijevic; Denis, Brajkovic; Nenadovic, Milos; Petar, Milovanovic; Marija, Djuric; Zlatko, Rakocevic

2013-09-01

The aim of this in vitro study was to compare the surface roughness parameters of four different types of dental luting agents used for cementation of implant restorations. Five specimens (8 mm high and 1 mm thick) of each cement were made using metal ring steelless molds. Atomic Force Microscope was employed to analyze different surface texture parameters of the materials. Bearing ratio analysis was used to calculate the potential microgap size between the cement and implant material and to calculate the depth of the valleys on the cement surface, while power spectral density (PSD) measurements were performed to measure the percentage of the surface prone to bacterial adhesion. Glass ionomer cement showed significantly lower value of average surface roughness then the other groups of the materials (P cement experience the lowest percentage of the surface which promote bacterial colonization. Glas ionomer cements present the surface roughness parameters that are less favorable for bacterial adhesion than that of zinc phosphate, resin-modified glass ionomer and resin cements. Copyright © 2013 Wiley Periodicals, Inc.

Simultaneous measurement of static and kinetic friction of ZnO nanowires in situ with a scanning electron microscope.

Science.gov (United States)

Polyakov, Boris; Dorogin, Leonid M; Vlassov, Sergei; Kink, Ilmar; Romanov, Alexey E; Lohmus, Rynno

2012-11-01

A novel method for in situ measurement of the static and kinetic friction is developed and demonstrated for zinc oxide nanowires (NWs) on oxidised silicon wafers. The experiments are performed inside a scanning electron microscope (SEM) equipped with a nanomanipulator with an atomic force microscope tip as a probe. NWs are pushed by the tip from one end until complete displacement is achieved, while NW bending is monitored by the SEM. The elastic bending profile of a NW during the manipulation process is used to calculate the static and kinetic friction forces. Copyright © 2012 Elsevier Ltd. All rights reserved.

High-speed imaging upgrade for a standard sample scanning atomic force microscope using small cantilevers

Energy Technology Data Exchange (ETDEWEB)

Adams, Jonathan D.; Nievergelt, Adrian; Erickson, Blake W.; Yang, Chen; Dukic, Maja; Fantner, Georg E., E-mail: georg.fantner@epfl.ch [Ecole Polytechnique Fédérale de Lausanne, Lausanne (Switzerland)

2014-09-15

We present an atomic force microscope (AFM) head for optical beam deflection on small cantilevers. Our AFM head is designed to be small in size, easily integrated into a commercial AFM system, and has a modular architecture facilitating exchange of the optical and electronic assemblies. We present two different designs for both the optical beam deflection and the electronic readout systems, and evaluate their performance. Using small cantilevers with our AFM head on an otherwise unmodified commercial AFM system, we are able to take tapping mode images approximately 5–10 times faster compared to the same AFM system using large cantilevers. By using additional scanner turnaround resonance compensation and a controller designed for high-speed AFM imaging, we show tapping mode imaging of lipid bilayers at line scan rates of 100–500 Hz for scan areas of several micrometers in size.

The Development of a Scanning Soft X-Ray Microscope.

Science.gov (United States)

Rarback, Harvey Miles

We have developed a scanning soft X-ray microscope, which can be used to image natural biological specimens at high resolution and with less damage than electron microscopy. The microscope focuses a monochromatic beam of synchrotron radiation to a nearly diffraction limited spot with the aid of a high resolution Fresnel zone plate, specially fabricated for us at the IBM Watson Research Center. The specimen at one atmosphere is mechanically scanned through the spot and the transmitted radiation is efficiently detected with a flow proportional counter. A computer forms a realtime transmission image of the specimen which is displayed on a color monitor. Our first generation optics have produced images of natural wet specimens at a resolution of 300 nm.

Development of system and technology for moessbauer spectroscopic microscope

Energy Technology Data Exchange (ETDEWEB)

Hayakawa, Kazuo; Akiyama, Yuki; Tsukamoto, Yoshinori; Kurata, Mikio; Yukihira, Kenichi [Shizuoka Institute of Science and Technology (Japan); Soejima, Hiroyoshi [Shimadzu Corporation (Japan); Yoshida, Yutaka, E-mail: yoshida@ms.sist.ac.jp [Shizuoka Institute of Science and Technology (Japan)

2012-03-15

We have been developing a 'Moessbauer Spectroscopic Microscope (MSM)' which consists of a focusing lens for 14.4 keV {gamma}-rays and a high precision X-Y stage. The measuring system both for electrons and {gamma}-rays combined with a new Moessbauer driver, i.e., 'a moving coil actuator with a liner encoder' enables us to measure the mapping images simultaneously corresponding to different spectral components. The system has a controlling system based on a LabVIEW program and a LIST mode data acquisition system (NIKI-GLASS/A3100). To investigate a correlation between the microstructure of a sample and {sup 57}Fe atoms, a scanning electron microscope (APCO/Mini-EOC) is also installed to this system.

Study of the mapping mechanism of ferroelectric domains with the scanning force microscope

International Nuclear Information System (INIS)

Jungk, T.

2006-12-01

The piezo-force microscopy (PFM) allows the mapping of ferroelectric domains until the nanometer range. In spite of its simple function principle it was hitherto not completely understood. In ordser to develop the PFM further to a quantitative analysis method its methodical aspects were analyzed. It was shown that the fundamental mapping mechanism is based on the inverse piezo-effect. Different artefacts to be found in the literature could therefore be reduced to a measurement background. Furthermore the influence of the electrode geometry was analyzed. The width of doamin walls was systematically measured and simulated with a mode, whereby a maximal resolution of 17 nm was reached. By the development of a correction procedure for the exact detection of the forces acting on the spring-beam the lateral signals measured on domain walls could by newly interpreted. So the ''Lateral Electrostatic Force Microscopy'' was developed

The system of digital-image optical microscope in semiconductor particle detector development

International Nuclear Information System (INIS)

Han Lixiang; Li Zhankui; Jin Genming; Wang Zhusheng; Xiao Guoqing

2009-01-01

Optical microscopic detection is very important in the process of semiconductor particle detector development. A system of digital-image optical microscope has been constructed with rather low price, which performance is comparable with the moderate-level imports. The system mounts powerful dry objective, and a 2μm resolution could be achieved. Observations with bright and dark field, polarized light,and interference light can be carried out on it. The system have large area on-line monitor,and the photographic device can be controlled by PC. It can be used in the control of defects and contaminations, pattern test, identification of crystal backing, inspection of the smoothness and the flatness of the crystal surface. It can also be used in some precise procedures, such as test, assembly, packaging and repairing. The quality of the bond could be examined by observing the appearance of the bond point and the microscopic structure of the solder. The surface fluctuation can be precisely measured under the microscope with the technology of multi-beam interference. In the article, the application of this system for semiconductor particle detector development has been illustrated, and the construction information has been described in detail. (authors)

Nanoscans of piezoelectric activity using an atomic force microscope

International Nuclear Information System (INIS)

Zheng, Z.; Guy, I.L.; Butcher, K.S.A.; Tansley, T.L.

2002-01-01

Full text: Any crystal which lacks a centre of symmetry is piezoelectric. This includes all of the ferroelectric crystals used in photonics and virtually all compound semiconductors. Such crystals, when grown in thin film form invariably exist in a strained state and thus possess internal piezoelectric fields which can affect their electronic properties. A knowledge of the piezoelectric properties of such crystals is thus important in understanding how they behave in practical devices. It also provides a tool for analysing the crystal structure of such materials. Using an atomic force microscope (AFM) as a probe of piezoelectric activity allows the study of variations in crystal structure on a nanoscale. The AFM piezoelectric technique has been used by several groups to study structures of ceramic materials with large piezoelectric coefficients, intended for applications in piezoelectric actuators. In the AFM method, a driving signal of a few volts at a frequency well below the AFM tip resonance, is applied to a sample of the material mounted in the AFM. This voltage causes the sample dimensions to change in ways determined by the piezoelectric properties of the sample. The AFM signal thus contains the normal surface profile information and an additional component generated by the piezoelectric vibrations of the sample. A lockin amplifier is used to separate the piezoelectric signal from the normal AFM surface profile signal. The result is the simultaneous acquisition of the surface profile and a piezoelectric map of the surface of the material under study. We will present results showing the results of such measurements in materials such as lithium niobate and gallium nitride. These materials have piezoelectric coefficients which are much lower than those of materials to which the technique has normally been applied

Controlling electron transfer processes on insulating surfaces with the non-contact atomic force microscope.

Science.gov (United States)

Trevethan, Thomas; Shluger, Alexander

2009-07-01

We present the results of theoretical modelling that predicts how a process of transfer of single electrons between two defects on an insulating surface can be induced using a scanning force microscope tip. A model but realistic system is employed which consists of a neutral oxygen vacancy and a noble metal (Pt or Pd) adatom on the MgO(001) surface. We show that the ionization potential of the vacancy and the electron affinity of the metal adatom can be significantly modified by the electric field produced by an ionic tip apex at close approach to the surface. The relative energies of the two states are also a function of the separation of the two defects. Therefore the transfer of an electron from the vacancy to the metal adatom can be induced either by the field effect of the tip or by manipulating the position of the metal adatom on the surface.

In Situ Roughness Measurements for the Solar Cell Industry Using an Atomic Force Microscope

Directory of Open Access Journals (Sweden)

Higinio González-Jorge

2010-04-01

Full Text Available Areal roughness parameters always need to be under control in the thin film solar cell industry because of their close relationship with the electrical efficiency of the cells. In this work, these parameters are evaluated for measurements carried out in a typical fabrication area for this industry. Measurements are made using a portable atomic force microscope on the CNC diamond cutting machine where an initial sample of transparent conductive oxide is cut into four pieces. The method is validated by making a comparison between the parameters obtained in this process and in the laboratory under optimal conditions. Areal roughness parameters and Fourier Spectral Analysis of the data show good compatibility and open the possibility to use this type of measurement instrument to perform in situ quality control. This procedure gives a sample for evaluation without destroying any of the transparent conductive oxide; in this way 100% of the production can be tested, so improving the measurement time and rate of production.

Microscopic and macroscopic models for pedestrian crowds

OpenAIRE

Makmul, Juntima

2016-01-01

This thesis is concerned with microscopic and macroscopic models for pedes- trian crowds. In the first chapter, we consider pedestrians exit choices and model human behaviour in an evacuation process. Two microscopic models, discrete and continuous, are studied in this chapter. The former is a cellular automaton model and the latter is a social force model. Different numerical test cases are investigated and their results are compared. In chapter 2, a hierarchy of models for...

Development of hard X-ray dark-field microscope using full-field optics

International Nuclear Information System (INIS)

Takano, Hidekazu; Azuma, Hiroaki; Shimomura, Sho; Tsuji, Takuya; Tsusaka, Yoshiyuki; Kagoshima, Yasushi

2016-01-01

We develop a dark-field X-ray microscope using full-field optics based on a synchrotron beamline. Our setup consists of a condenser system and a microscope objective with an angular acceptance larger than that of the condenser. The condenser system is moved downstream from its regular position such that the focus of the condenser is behind the objective. The dark-field microscope optics are configured by excluding the converging beam from the condenser at the focal point. The image properties of the system are evaluated by observing and calculating a Siemens star test chart with 10 keV X-rays. Our setup allows easy switching to bright-field imaging. (author)

Development of a fluorescent microscope combined with a real-time autoradiography system

International Nuclear Information System (INIS)

Rai, Hiroki; Kanno, Satomi; Hayashi, Yoshitake; Nihei, Naoto; Nakanishi, Tomoko M.

2008-01-01

For combination with microscope, we developed real-time autoradiography system for micro-scale analysis with adjustment of the CsI(Ti) scintillator thickness for higher resolution and applying tapered fiber optic plate for magnification of autoradiograph image. We combined real-time autoradiography system with an inverted fluorescent microscope so that an autoradiograph image as well as fluorescent image, bright-field image can be acquired at the same time. In the case of observation of sliced soybean stalk traced 45 CaCl, the fluorescent and bright-field image was acquired which magnified to 50 times, the autoradiograph image of 45 Ca distribution in the tissue was acquired in almost same scale. The new microscopic system which can acquire autoradiograph image of labeled signals (low molecular weight) is expected to develop the signal transduction study and gene expression, combined with fluorescent protein techniques such as GFP etc. (author)

Descriptions of membrane mechanics from microscopic and effective two-dimensional perspectives

International Nuclear Information System (INIS)

Lomholt, Michael A; Miao Ling

2006-01-01

Mechanics of fluid membranes may be described in terms of the concepts of mechanical deformations and stresses or in terms of mechanical free-energy functions. In this paper, each of the two descriptions is developed by viewing a membrane from two perspectives: a microscopic perspective, in which the membrane appears as a thin layer of finite thickness and with highly inhomogeneous material and force distributions in its transverse direction, and an effective, two-dimensional perspective, in which the membrane is treated as an infinitely thin surface, with effective material and mechanical properties. A connection between these two perspectives is then established. Moreover, the functional dependence of the variation in the mechanical free energy of the membrane on its mechanical deformations is first studied in the microscopic perspective. The result is then used to examine to what extent different, effective mechanical stresses and forces can be derived from a given, effective functional of the mechanical free energy

Ageing effects on polymeric track detectors: studies of etched tracks at nano size scale using atomic force microscope

International Nuclear Information System (INIS)

Espinosa, G.; Golzarri, J. I.; Fragoso, R.; Vazquez L, C.; Saad, A. F.; El-Namrouty, A. A.; Fujii, M.

2012-01-01

Among several different techniques to analyze material surface, the use of Atomic Force Microscope is one of the finest method. As we know, the sensitivity to detect energetic ions is extremely affected during the storage time and conditions of the polymeric material used as a nuclear track detector. On the basis of the surface analysis of several track detector materials, we examined the detection sensitivity of these detectors exposed to alpha particles. The preliminary results revealed that the ageing effect on its sensitivity is very strong, that need to be considered on the routine applications or research experiments. The results are consistent with the experimental data in the literature. (Author)

Direct characterization of spin-transfer switching of nano-scale magnetic tunnel junctions using a conductive atomic force microscope

International Nuclear Information System (INIS)

Lee, Jia-Mou; Yang, Dong-Chin; Lee, Ching-Ming; Ye, Lin-Xiu; Chang, Yao-Jen; Wu, Te-ho; Lee, Yen-Chi; Wu, Jong-Ching

2013-01-01

We present an alternative method of spin-transfer-induced magnetization switching for magnetic tunnel junctions (MTJs) using a conductive atomic force microscope (CAFM) with pulsed current. The nominal MTJ cells' dimensions were 200 × 400 nm 2 . The AFM probes were coated with a Pt layer via sputtering to withstand up to several milliamperes. The pulsed current measurements, with pulse duration varying from 5 to 300 ms, revealed a magnetoresistance ratio of up to 120%, and an estimated intrinsic switching current density, based on the thermal activation model, of 3.94 MA cm −2 . This method demonstrates the potential skill to characterize nanometre-scale magnetic devices. (paper)

Nanoscopic morphological changes in yeast cell surfaces caused by oxidative stress: an atomic force microscopic study.

Science.gov (United States)

Canetta, Elisabetta; Walker, Graeme M; Adya, Ashok K

2009-06-01

Nanoscopic changes in the cell surface morphology of the yeasts Saccharomyces cerevisiae (strain NCYC 1681) and Schizosaccharomyces pombe (strain DVPB 1354), due to their exposure to varying concentrations of hydrogen peroxide (oxidative stress), were investigated using an atomic force microscope (AFM). Increasing hydrogen peroxide concentration led to a decrease in cell viabilities and mean cell volumes, and an increase in the surface roughness of the yeasts. In addition, AFM studies revealed that oxidative stress caused cell compression in both S. cerevisiae and Schiz. pombe cells and an increase in the number of aged yeasts. These results confirmed the importance and usefulness of AFM in investigating the morphology of stressed microbial cells at the nanoscale. The results also provided novel information on the relative oxidative stress tolerance of S. cerevisiae and Schiz. pombe.

Atomic force microscope image contrast mechanisms on supported lipid bilayers.

Science.gov (United States)

Schneider, J; Dufrêne, Y F; Barger, W R; Lee, G U

2000-08-01

This work presents a methodology to measure and quantitatively interpret force curves on supported lipid bilayers in water. We then use this method to correlate topographic imaging contrast in atomic force microscopy (AFM) images of phase-separated Langmuir-Blodgett bilayers with imaging load. Force curves collected on pure monolayers of both distearoylphosphatidylethanolamine (DSPE) and monogalactosylethanolamine (MGDG) and dioleoylethanolamine (DOPE) deposited at similar surface pressures onto a monolayer of DSPE show an abrupt breakthrough event at a repeatable, material-dependent force. The breakthrough force for DSPE and MGDG is sizable, whereas the breakthrough force for DOPE is too small to measure accurately. Contact-mode AFM images on 1:1 mixed monolayers of DSPE/DOPE and MGDG/DOPE have a high topographic contrast at loads between the breakthrough force of each phase, and a low topographic contrast at loads above the breakthrough force of both phases. Frictional contrast is inverted and magnified at loads above the breakthrough force of both phases. These results emphasize the important role that surface forces and mechanics can play in imaging multicomponent biomembranes with AFM.

Atomic force microscope and scanning tunneling microscope studies of superlattices and density waves in Fe doped NbSe2, TaSe2, TaS2 and in NbSe3 doped with Fe, Co, Cr, and V

International Nuclear Information System (INIS)

Coleman, R.V.; Dai, Z.; Gong, Y.; Slough, C.G.; Xue, Q.

1994-01-01

Results of atomic force microscope (AFM) and scanning tunneling microscope (STM) studies of superlattices and long-range modulations induced by impurities in transition metal chalcogenides are presented. Superlattices formed by Fe intercalation into the van der Waals gaps of 2H--NbSe 2 , 2H--TaSe 2 and 2H--TaS 2 show ordered occupation of the octahedral holes and STM spectroscopy shows density-wave energy gaps existing in the antiferromagnetic phases. In NbSe 3 , interstitial impurities such as Fe, Co, Cr, and V induce long-range modulated structures that can be detected at room temperature with AFM scans. These modulations modify the charge-density wave structure forming at low temperature and STM spectroscopy has been used to measure these changes

Scanning Color Laser Microscope

Science.gov (United States)

Awamura, D.; Ode, T.; Yonezawa, M.

1988-01-01

A confocal color laser microscope which utilizes a three color laser light source (Red: He-Ne, Green: Ar, Blue: Ar) has been developed and is finding useful applications in the semiconductor field. The color laser microscope, when compared to a conventional microscope, offers superior color separation, higher resolution, and sharper contrast. Recently some new functions including a Focus Scan Memory, a Surface Profile Measurement System, a Critical Dimension Measurement system (CD) and an Optical Beam Induced Current Function (OBIC) have been developed for the color laser microscope. This paper will discuss these new features.

Adhesion force imaging in air and liquid by adhesion mode atomic force microscopy

NARCIS (Netherlands)

van der Werf, Kees; Putman, C.A.J.; Putman, Constant A.; de Grooth, B.G.; Greve, Jan

1994-01-01

A new imaging mode for the atomic force microscope(AFM), yielding images mapping the adhesion force between tip and sample, is introduced. The adhesion mode AFM takes a force curve at each pixel by ramping a piezoactuator, moving the silicon‐nitride tip up and down towards the sample. During the

Tapping mode imaging and measurements with an inverted atomic force microscope.

Science.gov (United States)

Chan, Sandra S F; Green, John-Bruce D

2006-07-18

This report demonstrates the successful use of the inverted atomic force microscope (i-AFM) for tapping mode AFM imaging of cantilever-supported samples. i-AFM is a mode of AFM operation in which a sample supported on a tipless cantilever is imaged by one of many tips in a microfabricated tip array. Tapping mode is an intermittent contact mode whereby the cantilever is oscillated at or near its resonance frequency, and the amplitude and/or phase are used to image the sample. In the process of demonstrating that tapping mode images could be obtained in the i-AFM design, it was observed that the amplitude of the cantilever oscillation decreased markedly as the cantilever and tip array were approached. The source of this damping of the cantilever oscillations was identified to be the well-known "squeeze film damping", and the extent of damping was a direct consequence of the relatively shorter tip heights for the tip arrays, as compared to those of commercially available tapping mode cantilevers with integrated tips. The functional form for the distance dependence of the damping coefficient is in excellent agreement with previously published models for squeeze film damping, and the values for the fitting parameters make physical sense. Although the severe damping reduces the cantilever free amplitude substantially, we found that we were still able to access the low-amplitude regime of oscillation necessary for attractive tapping mode imaging of fragile molecules.

Inverted light-sheet microscope for imaging mouse pre-implantation development.

Science.gov (United States)

Strnad, Petr; Gunther, Stefan; Reichmann, Judith; Krzic, Uros; Balazs, Balint; de Medeiros, Gustavo; Norlin, Nils; Hiiragi, Takashi; Hufnagel, Lars; Ellenberg, Jan

2016-02-01

Despite its importance for understanding human infertility and congenital diseases, early mammalian development has remained inaccessible to in toto imaging. We developed an inverted light-sheet microscope that enabled us to image mouse embryos from zygote to blastocyst, computationally track all cells and reconstruct a complete lineage tree of mouse pre-implantation development. We used this unique data set to show that the first cell fate specification occurs at the 16-cell stage.

Effect of cantilever geometry on the optical lever sensitivities and thermal noise method of the atomic force microscope.

Science.gov (United States)

Sader, John E; Lu, Jianing; Mulvaney, Paul

2014-11-01

Calibration of the optical lever sensitivities of atomic force microscope (AFM) cantilevers is especially important for determining the force in AFM measurements. These sensitivities depend critically on the cantilever mode used and are known to differ for static and dynamic measurements. Here, we calculate the ratio of the dynamic and static sensitivities for several common AFM cantilevers, whose shapes vary considerably, and experimentally verify these results. The dynamic-to-static optical lever sensitivity ratio is found to range from 1.09 to 1.41 for the cantilevers studied - in stark contrast to the constant value of 1.09 used widely in current calibration studies. This analysis shows that accuracy of the thermal noise method for the static spring constant is strongly dependent on cantilever geometry - neglect of these dynamic-to-static factors can induce errors exceeding 100%. We also discuss a simple experimental approach to non-invasively and simultaneously determine the dynamic and static spring constants and optical lever sensitivities of cantilevers of arbitrary shape, which is applicable to all AFM platforms that have the thermal noise method for spring constant calibration.

Atomic force microscopic neutron-induced alpha-autoradiography for boron imaging in detailed cellular histology

International Nuclear Information System (INIS)

Amemiya, K.; Takahashi, H.; Fujita, K.; Nakazawa, M.; Yanagie, H.; Eriguchi, M.; Nakagawa, Y.; Sakurai, Y.

2006-01-01

The information on subcellular microdistribution of 10 B compounds a cell is significant to evaluate the efficacy of boron neutron capture therapy (BNCT) because the damage brought by the released alpha/lithium particles is highly localized along their path, and radiation sensitivity is quite different among each cell organelles. In neutron-induced alpha-autoradiography (NIAR) technique, 10 B can be measured as tracks for the energetic charged particles from 10 B(n, alpha) 7 Li reactions in solid state track detectors. To perform the NIAR at intracellular structure level for research of 10 B uptake and/or microdosimetry in BNCT, we have developed high-resolution NIAR method with an atomic force microscope (AFM). AFM has been used for analyses of biological specimens such as proteins, DNAs and surface of living cells have, however, intracellular detailed histology of cells has been hardly resolved with AFM since flat surface of sectioned tissue has quite less topographical contrast among each organelle. In our new sample preparation method using UV processing, materials that absorb UV in a semi-thin section are selectively eroded and vaporized by UV exposure, and then fine relief for cellular organelles such as mitochondria, endoplasmic reticulum, filament structure and so on reveals on flat surface of the section, which can be observed with an AFM. The imaging resolution was comparable to TEM imaging of cells. This new method provides fast and cost-effective observation of histological sections with an AFM. Combining this method with NIAR technique, intracellular boron mapping would be possible. (author)

Serum induced degradation of 3D DNA box origami observed by high speed atomic force microscope

DEFF Research Database (Denmark)

Jiang, Zaixing; Zhang, Shuai; Yang, Chuanxu

2015-01-01

3D DNA origami holds tremendous potential to encapsulate and selectively release therapeutic drugs. Observations of real-time performance of 3D DNA origami structures in physiological environment will contribute much to its further applications. Here, we investigate the degradation kinetics of 3D...... DNA box origami in serum using high-speed atomic force microscope optimized for imaging 3D DNA origami in real time. The time resolution allows characterizing the stages of serum effects on individual 3D DNA box origami with nanometer resolution. Our results indicate that the whole digest process...... is a combination of a rapid collapse phase and a slow degradation phase. The damages of box origami mainly happen in the collapse phase. Thus, the structure stability of 3D DNA box origami should be further improved, especially in the collapse phase, before clinical applications...

The asymmetrical structure of Golgi apparatus membranes revealed by in situ atomic force microscope.

Directory of Open Access Journals (Sweden)

Haijiao Xu

Full Text Available The Golgi apparatus has attracted intense attentions due to its fascinating morphology and vital role as the pivot of cellular secretory pathway since its discovery. However, its complex structure at the molecular level remains elusive due to limited approaches. In this study, the structure of Golgi apparatus, including the Golgi stack, cisternal structure, relevant tubules and vesicles, were directly visualized by high-resolution atomic force microscope. We imaged both sides of Golgi apparatus membranes and revealed that the outer leaflet of Golgi membranes is relatively smooth while the inner membrane leaflet is rough and covered by dense proteins. With the treatment of methyl-β-cyclodextrin and Triton X-100, we confirmed the existence of lipid rafts in Golgi apparatus membrane, which are mostly in the size of 20 nm -200 nm and appear irregular in shape. Our results may be of significance to reveal the structure-function relationship of the Golgi complex and pave the way for visualizing the endomembrane system in mammalian cells at the molecular level.

Field programmable gate array based reconfigurable scanning probe/optical microscope.

Science.gov (United States)

Nowak, Derek B; Lawrence, A J; Dzegede, Zechariah K; Hiester, Justin C; Kim, Cliff; Sánchez, Erik J

2011-10-01

The increasing popularity of nanometrology and nanospectroscopy has pushed researchers to develop complex new analytical systems. This paper describes the development of a platform on which to build a microscopy tool that will allow for flexibility of customization to suit research needs. The novelty of the described system lies in its versatility of capabilities. So far, one version of this microscope has allowed for successful near-field and far-field fluorescence imaging with single molecule detection sensitivity. This system is easily adapted for reflection, polarization (Kerr magneto-optical (MO)), Raman, super-resolution techniques, and other novel scanning probe imaging and spectroscopic designs. While collecting a variety of forms of optical images, the system can simultaneously monitor topographic information of a sample with an integrated tuning fork based shear force system. The instrument has the ability to image at room temperature and atmospheric pressure or under liquid. The core of the design is a field programmable gate array (FPGA) data acquisition card and a single, low cost computer to control the microscope with analog control circuitry using off-the-shelf available components. A detailed description of electronics, mechanical requirements, and software algorithms as well as examples of some different forms of the microscope developed so far are discussed.

Immobilization method of yeast cells for intermittent contact mode imaging using the atomic force microscope

International Nuclear Information System (INIS)

De, Tathagata; Chettoor, Antony M.; Agarwal, Pranav; Salapaka, Murti V.; Nettikadan, Saju

2010-01-01

The atomic force microscope (AFM) is widely used for studying the surface morphology and growth of live cells. There are relatively fewer reports on the AFM imaging of yeast cells (Kasas and Ikai, 1995), (Gad and Ikai, 1995). Yeasts have thick and mechanically strong cell walls and are therefore difficult to attach to a solid substrate. In this report, a new immobilization technique for the height mode imaging of living yeast cells in solid media using AFM is presented. The proposed technique allows the cell surface to be almost completely exposed to the environment and studied using AFM. Apart from the new immobilization protocol, for the first time, height mode imaging of live yeast cell surface in intermittent contact mode is presented in this report. Stable and reproducible imaging over a 10-h time span is observed. A significant improvement in operational stability will facilitate the investigation of growth patterns and surface patterns of yeast cells.

A new technical approach to quantify cell-cell adhesion forces by AFM

International Nuclear Information System (INIS)

Puech, Pierre-Henri; Poole, Kate; Knebel, Detlef; Muller, Daniel J.

2006-01-01

Cell-cell adhesion is a complex process that is involved in the tethering of cells, cell-cell communication, tissue formation, cell migration and the development and metastasis of tumors. Given the heterogeneous and complex nature of cell surfaces it has previously proved difficult to characterize individual cell-cell adhesion events. Force spectroscopy, using an atomic force microscope, is capable of resolving such individual cell-cell binding events, but has previously been limited in its application due to insufficient effective pulling distances. Extended pulling range is critical in studying cell-cell interactions due to the potential for large cell deformations. Here we describe an approach to such experiments, where the sample stage can be moved 100 μm in the z-direction, by closed loop, linearized piezo elements. Such an approach enables an increase in pulling distance sufficient for the observation of long-distance cell-unbinding events without reducing the imaging capabilities of the atomic force microscope. The atomic force microscope head and the piezo-driven sample stage are installed on an inverted optical microscope fitted with a piezo-driven objective, to allow the monitoring of cell morphology by conventional light microscopy, concomitant with force spectroscopy measurements. We have used the example of the WM115 melanoma cell line binding to human umbilical vein endothelial cells to demonstrate the capabilities of this system and the necessity for such an extended pulling range when quantifying cell-cell adhesion events

A miniaturized, high frequency mechanical scanner for high speed atomic force microscope using suspension on dynamically determined points

Energy Technology Data Exchange (ETDEWEB)

Herfst, Rodolf; Dekker, Bert; Witvoet, Gert; Crowcombe, Will; Lange, Dorus de [Department of Optomechatronics, Netherlands Organization for Applied Scientific Research, TNO, Delft (Netherlands); Sadeghian, Hamed, E-mail: hamed.sadeghianmarnani@tno.nl, E-mail: h.sadeghianmarnani@tudelft.nl [Department of Optomechatronics, Netherlands Organization for Applied Scientific Research, TNO, Delft (Netherlands); Department of Precision and Microsystems Engineering, Delft University of Technology, Delft (Netherlands)

2015-11-15

One of the major limitations in the speed of the atomic force microscope (AFM) is the bandwidth of the mechanical scanning stage, especially in the vertical (z) direction. According to the design principles of “light and stiff” and “static determinacy,” the bandwidth of the mechanical scanner is limited by the first eigenfrequency of the AFM head in case of tip scanning and by the sample stage in terms of sample scanning. Due to stringent requirements of the system, simply pushing the first eigenfrequency to an ever higher value has reached its limitation. We have developed a miniaturized, high speed AFM scanner in which the dynamics of the z-scanning stage are made insensitive to its surrounding dynamics via suspension of it on specific dynamically determined points. This resulted in a mechanical bandwidth as high as that of the z-actuator (50 kHz) while remaining insensitive to the dynamics of its base and surroundings. The scanner allows a practical z scan range of 2.1 μm. We have demonstrated the applicability of the scanner to the high speed scanning of nanostructures.

An Atomic Force Microscope Study Revealed Two Mechanisms in the Effect of Anticancer Drugs on Rate-Dependent Young's Modulus of Human Prostate Cancer Cells.

Directory of Open Access Journals (Sweden)

Juan Ren

Full Text Available Mechanical properties of cells have been recognized as a biomarker for cellular cytoskeletal organization. As chemical treatments lead to cell cytoskeletal rearrangements, thereby, modifications of cellular mechanical properties, investigating cellular mechanical property variations provides insightful knowledge to effects of chemical treatments on cancer cells. In this study, the effects of eight different anticancer drugs on the mechanical properties of human prostate cancer cell (PC-3 are investigated using a recently developed control-based nanoindentation measurement (CNM protocol on atomic force microscope (AFM. The CNM protocol overcomes the limits of other existing methods to in-liquid nanoindentation measurement of live cells on AFM, particularly for measuring mechanical properties of live cells. The Young's modulus of PC-3 cells treated by the eight drugs was measured by varying force loading rates over three orders of magnitude, and compared to the values of the control. The results showed that the Young's modulus of the PC-3 cells increased substantially by the eight drugs tested, and became much more pronounced as the force load rate increased. Moreover, two distinct trends were clearly expressed, where under the treatment of Disulfiram, paclitaxel, and MK-2206, the exponent coefficient of the frequency- modulus function remained almost unchanged, while with Celebrex, BAY, Totamine, TPA, and Vaproic acid, the exponential rate was significantly increased.

Development of Near-Field Microwave Microscope with the Functionality of Scanning Tunneling Spectroscopy

Science.gov (United States)

Machida, Tadashi; Gaifullin, Marat B.; Ooi, Shuuich; Kato, Takuya; Sakata, Hideaki; Hirata, Kazuto

2010-11-01

We describe the details of an original near-field scanning microwave microscope, developed for simultaneous measurements of local density-of-states (LDOS) and local ohmic losses (LOL). Improving microwave detection systems, we have succeeded in distinguishing the LDOS and LOL even between two low resistance materials; gold and highly orientated pyrolitic graphite. The experimental data indicate that our microscope holds a capability to investigate both LDOS and LOL in nanoscale.

The development of a high speed 3D 2-photon microscope for neuroscience

OpenAIRE

Kirkby, P. A.

2010-01-01

The progress of neuroscience is limited by the instrumentation available to it for studying the brain. At present, there is a serious instrumentation gap between functional Magnetic Resonance Imaging (fMRI) of whole brains and the microscopic scale functional imaging possible with today’s optical microscopes and electrophysiology techniques, such as patch clamping of individual neurons. This thesis describes the development of a new extension to optical microscopy that enabl...

Principles and applications of force spectroscopy using atomic force microscopy

Energy Technology Data Exchange (ETDEWEB)

Kim, Young Kyu; Kim, Woong; Park, Joon Won [Dept. of Chemistry, Pohang University of Science and Technology, Pohang (Korea, Republic of)

2016-12-15

Single-molecule force spectroscopy is a powerful technique for addressing single molecules. Unseen structures and dynamics of molecules have been elucidated using force spectroscopy. Atomic force microscope (AFM)-based force spectroscopy studies have provided picoNewton force resolution, subnanometer spatial resolution, stiffness of substrates, elasticity of polymers, and thermodynamics and kinetics of single-molecular interactions. In addition, AFM has enabled mapping the distribution of individual molecules in situ, and the quantification of single molecules has been made possible without modification or labeling. In this review, we describe the basic principles, sample preparation, data analysis, and applications of AFM-based force spectroscopy and its future.

Local work function analysis of Pt/TiO2 photocatalyst by a Kelvin probe force microscope

International Nuclear Information System (INIS)

Hiehata, K; Sasahara, A; Onishi, H

2007-01-01

Nanometre-sized Pt clusters were prepared on a TiO 2 (110)-(1 x 1) surface, and the lateral distribution of work function was examined by using a Kelvin probe force microscope. Local work function on the Pt clusters was smaller than that on the surrounding TiO 2 surface. Assuming that the dipole moments which perturb the work function are produced by uneven electron distribution, the decrease of the work function indicates electron transfer from the clusters to the TiO 2 surface. After decomposition of pivalate anions on the surfaces by UV irradiation, the work function increased on some Pt clusters. It is known that holes photoexcited in TiO 2 attach to pivalate anions to cause a decomposition reaction. Hence the increase of the observed work function by UV irradiation can be ascribed to the trapping of the accompanying electrons to the Pt clusters

Effect of the interaction conditions of the probe of an atomic-force microscope with the n-GaAs surface on the triboelectrization phenomenon

Energy Technology Data Exchange (ETDEWEB)

Baklanov, A. V., E-mail: baklanov@mail.ioffe.ru [St. Petersburg State Polytechnical University, Institute of Physics, Nanotechnology, and Telecommunications (Russian Federation); Gutkin, A. A.; Kalyuzhnyy, N. A. [Russian Academy of Sciences, Ioffe Institute (Russian Federation); Brunkov, P. N. [St. Petersburg State Polytechnical University, Institute of Physics, Nanotechnology, and Telecommunications (Russian Federation)

2015-08-15

Triboelectrization as a result of the scanning of an atomic-force-microscope probe over an n-GaAs surface in the contact mode is investigated. The dependences of the local potential variation on the scanning rate and the pressing force of the probe are obtained. The results are explained by point-defect formation in the surface layers of samples under the effect of deformation of these layers during probe scanning. The charge localized at these defects in the case of equilibrium changes the potential of surface, which is subject to triboelectrization. It is shown that, for qualitative explanation of the observed dependences, it is necessary to take into account both the generation and annihilation of defects in the region experiencing deformation.

Evaluation of a completely robotized neurosurgical operating microscope.

Science.gov (United States)

Kantelhardt, Sven R; Finke, Markus; Schweikard, Achim; Giese, Alf

2013-01-01

Operating microscopes are essential for most neurosurgical procedures. Modern robot-assisted controls offer new possibilities, combining the advantages of conventional and automated systems. We evaluated the prototype of a completely robotized operating microscope with an integrated optical coherence tomography module. A standard operating microscope was fitted with motors and control instruments, with the manual control mode and balance preserved. In the robot mode, the microscope was steered by a remote control that could be fixed to a surgical instrument. External encoders and accelerometers tracked microscope movements. The microscope was additionally fitted with an optical coherence tomography-scanning module. The robotized microscope was tested on model systems. It could be freely positioned, without forcing the surgeon to take the hands from the instruments or avert the eyes from the oculars. Positioning error was about 1 mm, and vibration faded in 1 second. Tracking of microscope movements, combined with an autofocus function, allowed determination of the focus position within the 3-dimensional space. This constituted a second loop of navigation independent from conventional infrared reflector-based techniques. In the robot mode, automated optical coherence tomography scanning of large surface areas was feasible. The prototype of a robotized optical coherence tomography-integrated operating microscope combines the advantages of a conventional manually controlled operating microscope with a remote-controlled positioning aid and a self-navigating microscope system that performs automated positioning tasks such as surface scans. This demonstrates that, in the future, operating microscopes may be used to acquire intraoperative spatial data, volume changes, and structural data of brain or brain tumor tissue.

Plan for SQUID microscope at ASRC: Vision, purposes and the present status

International Nuclear Information System (INIS)

Kadowaki, K.; Kakeya, I.; Suzuki, J.; Hata, Y.; Hojyo, K

2001-01-01

A new research plan to develop SQUID microscope and apply it to advanced science and technology research was started in the year of 2000 at the Advanced Science Research Center (ASRC) of JAERI (Japan Atomic Energy Research Institute). This plan was made to develop 'research of ultrafine magnetic structures with magnetic microscope' and is scheduled to continue five years. Principle of SQUID magnetic microscope is to observe changes of magnetic field in microscopic space using SQUID element as the magnetic probe. At present this type of instrument is fabricated by Seiko Instruments Inc. in Japan and is commercially available. Therefore, this plan is being promoted in collaboration with Seiko Instruments Inc. One of the main issues of the present plan is to raise the spatial resolution to the extremity. As of magnetic microscopes, 'magnetic force microscope' and 'scanning Hall probe microscope' also exist. They have different characteristics of their own. The present plan needs challenging technical developments in various fields. Supposed the spatial resolution be made very high, for example, by making very fine SQUID loop with ultrafine processing, critical technologies like sensitivity, electronics, quantum size effect and so on are to be solved at the same time. Characteristics of the existing instrument are being examined from various aspects. At present, the following three issues are taken up and being studied. (1) High resolution and related technical developments. (2) High sensitivity. (3) High performance of cooling system. Among them, the high resolution is the most serious problem. Completely new design of the SQUID system may be needed. By using the existing instrument, magnetic fluxes trapped on YBCO films are observed and the image quality is being examined. Some of the issues which are considered to be taken up now are listed as follows. (1) Magnetic domain structures on thin film magnetic materials. (2) Observation of structures of Josephson magnetic

Mapping Electrostatic Forces Using Higher Harmonics Tapping Mode Atomic Force Microscopy in Liquid

NARCIS (Netherlands)

van Noort, S.J.T.; Willemsen, O.H.; van der Werf, Kees; de Grooth, B.G.; Greve, Jan

1999-01-01

A simple model of a damped, harmonic oscillator is used to describe the motion of an atomic force microscope cantilever tapping in fluid. By use of experimentally obtained parameters, excellent agreement is found between theory and experimental results. From the model we estimate that the force

Seamless stitching of tile scan microscope images.

Science.gov (United States)

Legesse, F B; Chernavskaia, O; Heuke, S; Bocklitz, T; Meyer, T; Popp, J; Heintzmann, R

2015-06-01

For diagnostic purposes, optical imaging techniques need to obtain high-resolution images of extended biological specimens in reasonable time. The field of view of an objective lens, however, is often smaller than the sample size. To image the whole sample, laser scanning microscopes acquire tile scans that are stitched into larger mosaics. The appearance of such image mosaics is affected by visible edge artefacts that arise from various optical aberrations which manifest in grey level jumps across tile boundaries. In this contribution, a technique for stitching tiles into a seamless mosaic is presented. The stitching algorithm operates by equilibrating neighbouring edges and forcing the brightness at corners to a common value. The corrected image mosaics appear to be free from stitching artefacts and are, therefore, suited for further image analysis procedures. The contribution presents a novel method to seamlessly stitch tiles captured by a laser scanning microscope into a large mosaic. The motivation for the work is the failure of currently existing methods for stitching nonlinear, multimodal images captured by our microscopic setups. Our method eliminates the visible edge artefacts that appear between neighbouring tiles by taking into account the overall illumination differences among tiles in such mosaics. The algorithm first corrects the nonuniform brightness that exists within each of the tiles. It then compensates for grey level differences across tile boundaries by equilibrating neighbouring edges and forcing the brightness at the corners to a common value. After these artefacts have been removed further image analysis procedures can be applied on the microscopic images. Even though the solution presented here is tailored for the aforementioned specific case, it could be easily adapted to other contexts where image tiles are assembled into mosaics such as in astronomical or satellite photos. © 2015 The Authors Journal of Microscopy © 2015 Royal

Fully low voltage and large area searching scanning tunneling microscope

International Nuclear Information System (INIS)

Pang, Zongqiang; Wang, Jihui; Lu, Qingyou

2009-01-01

We present a novel scanning tunneling microscope (STM), which allows the tip to travel a large distance (millimeters) on the sample and take images (to find microscopic targets) anywhere it reaches without losing atomic resolution. This broad range searching capability, together with the coarse approach and scan motion, is all done with only one single piezoelectric tube scanner as well as with only low voltages (<15 V). Simple structure, low interference and high precision are thus achieved. To this end, a pillar and a tube scanner are mounted in parallel on a base with one ball glued on the pillar top and two balls glued on the scanner top. These three balls form a narrow triangle, which supports a triangular slider piece. By inertial stepping, the scanner can move the slider toward the pillar (coarse approach) or rotate the slider about the pillar (travel along sample surface). Since all the stepping motions are driven by the scanner's lateral bending which is large per unit voltage, high voltages are unnecessary. The technology is also applicable to scanning force microscopes (SFM) such as atomic force microscopes (AFM), etc

Dissipation and oscillatory solvation forces in confined liquids studied by small amplitude atomic force spectroscopy

NARCIS (Netherlands)

de Beer, Sissi; van den Ende, Henricus T.M.; Mugele, Friedrich

2010-01-01

We determine conservative and dissipative tip–sample interaction forces from the amplitude and phase response of acoustically driven atomic force microscope (AFM) cantilevers using a non-polar model fluid (octamethylcyclotetrasiloxane, which displays strong molecular layering) and atomically flat

Biomolecule recognition using piezoresistive nanomechanical force probes

Science.gov (United States)

Tosolini, Giordano; Scarponi, Filippo; Cannistraro, Salvatore; Bausells, Joan

2013-06-01

Highly sensitive sensors are one of the enabling technologies for the biomarker detection in early stage diagnosis of pathologies. We have developed a self-sensing nanomechanical force probe able for detecting the unbinding of single couples of biomolecular partners in nearly physiological conditions. The embedding of a piezoresistive transducer into a nanomechanical cantilever enabled high force measurement capability with sub 10-pN resolution. Here, we present the design, microfabrication, optimization, and complete characterization of the sensor. The exceptional electromechanical performance obtained allowed us to detect biorecognition specific events underlying the biotin-avidin complex formation, by integrating the sensor in a commercial atomic force microscope.

Effect of contact stiffness on wedge calibration of lateral force in atomic force microscopy

International Nuclear Information System (INIS)

Wang Fei; Zhao Xuezeng

2007-01-01

Quantitative friction measurement of nanomaterials in atomic force microscope requires accurate calibration method for lateral force. The effect of contact stiffness on lateral force calibration of atomic force microscope is discussed in detail and an improved calibration method is presented. The calibration factor derived from the original method increased with the applied normal load, which indicates that separate calibration should be required for every given applied normal load to keep the accuracy of friction measurement. We improve the original method by introducing the contact factor, which is derived from the contact stiffness between the tip and the sample, to the calculation of calibration factors. The improved method makes the calculation of calibration factors under different applied normal loads possible without repeating the calibration procedure. Comparative experiments on a silicon wafer have been done by both the two methods to validate the method in this article

Raman-atomic force microscopy of the ommatidial surfaces of Dipteran compound eyes

Science.gov (United States)

Anderson, Mark S.; Gaimari, Stephen D.

2003-01-01

The ommatidial lens surfaces of the compound eyes in several species of files (Insecta: Diptera) and a related order (Mecoptera) were analyzed using a recently developed Raman-atomic force microscope. We demonstrate in this work that the atomic force microscope (AFM) is a potentially useful instrument for gathering phylogenetic data and that the newly developed Raman-AFM may extend this application by revealing nanometer-scale surface chemistry. This is the first demonstration of apertureless near-field Raman spectroscopy on an intact biological surface. For Chrysopilus testaceipes Bigot (Rhagionidae), this reveals unique cerebral cortex-like surface ridges with periodic variation in height and surface chemistry. Most other Brachyceran flies, and the "Nematoceran" Sylvicola fenestralis (Scopoli) (Anisopodidae), displayed the same morphology, while other taxa displayed various other characteristics, such as a nodule-like (Tipula (Triplicitipula) sp. (Tipulidae)) or coalescing nodule-like (Tabanus punctifer Osten Sacken (Tabanidae)) morphology, a smooth morphology with distinct pits and grooves (Dilophus orbatus (Say) (Bibionidae)), or an entirely smooth surface (Bittacus chlorostigma MacLachlan (Mecoptera: Bittacidae)). The variation in submicrometer structure and surface chemistry provides a new information source of potential phylogenetic importance, suggesting the Raman-atomic force microscope could provide a new tool useful to systematic and evolutionary inquiry.

Attachment of carbon nanotubes to atomic force microscope probes

International Nuclear Information System (INIS)

Gibson, Christopher T.; Carnally, Stewart; Roberts, Clive J.

2007-01-01

In atomic force microscopy (AFM) the accuracy of data is often limited by the tip geometry and the effect on this geometry of wear. One way to improve the tip geometry is to attach carbon nanotubes (CNT) to AFM tips. CNTs are ideal because they have a small diameter (typically between 1 and 20 nm), high aspect ratio, high strength, good conductivity, and almost no wear. A number of methods for CNT attachment have been proposed and explored including chemical vapour deposition (CVD), dielectrophoresis, arc discharge and mechanical attachment. In this work we will use CVD to deposit nanotubes onto a silicon surface and then investigate improved methods to pick-up and attach CNTs to tapping mode probes. Conventional pick-up methods involve using standard tapping mode or non-contact mode so as to attach only those CNTs that are aligned vertically on the surface. We have developed improved methods to attach CNTs using contact mode and reduced set-point tapping mode imaging. Using these techniques the AFM tip is in contact with a greater number of CNTs and the rate and stability of CNT pick-up is improved. The presence of CNTs on the modified AFM tips was confirmed by high-resolution AFM imaging, analysis of the tips dynamic force curves and scanning electron microscopy (SEM)

Mechanically modulated dewetting by atomic force microscope for micro- and nano- droplet array fabrication.

Science.gov (United States)

Wang, Feifei; Li, Pan; Wang, Dong; Li, Longhai; Xie, Shuangxi; Liu, Lianqing; Wang, Yuechao; Li, Wen Jung

2014-10-06

Organizing a material into well-defined patterns during the dewetting process provides an attractive micro-/nano-fabrication method without using a conventional lithographic process, and hence, offers potential applications in organic electronics, optics systems, and memory devices. We report here how the mechanical modification of polymer surface by an Atomic Force Microscope (AFM) can be used to guide thin film dewetting evolution and break the intrinsic spatial correlation of spontaneous instability. An AFM is used to implement the mechanical modification of progressively narrow grids to investigate the influence of pattern size on the modulation of ultrathin polystyrene films dewetting evolution. For films with different initial thicknesses, when grid size is close to or below the characteristic wavelength of instability, the spinodal dewetting is suppressed, and film rupture is restricted to the cutting trench. We will show in this paper it is possible to generate only one droplet per gridded area on a thin film subsequent to nucleation dominated dewetting on a non-patterned substrate. Furthermore, when the grid periodicity exceeds the spinodal length, the number of droplets in predefined areas gradually approaches that associated with unconfined dewetting.

Apertureless near-field/far-field CW two-photon microscope for biological and material imaging and spectroscopic applications.

Science.gov (United States)

Nowak, Derek B; Lawrence, A J; Sánchez, Erik J

2010-12-10

We present the development of a versatile spectroscopic imaging tool to allow for imaging with single-molecule sensitivity and high spatial resolution. The microscope allows for near-field and subdiffraction-limited far-field imaging by integrating a shear-force microscope on top of a custom inverted microscope design. The instrument has the ability to image in ambient conditions with optical resolutions on the order of tens of nanometers in the near field. A single low-cost computer controls the microscope with a field programmable gate array data acquisition card. High spatial resolution imaging is achieved with an inexpensive CW multiphoton excitation source, using an apertureless probe and simplified optical pathways. The high-resolution, combined with high collection efficiency and single-molecule sensitive optical capabilities of the microscope, are demonstrated with a low-cost CW laser source as well as a mode-locked laser source.

Development of laser plasma x-ray microscope for living hydrated biological specimens

International Nuclear Information System (INIS)

Kado, Masataka; Daido, Hiroyuki

2005-01-01

Investigating the structure and the function of life object performing advanced life activity becomes important. In order to investigate the life object, it is necessary to observe living specimens with high spatial resolution and high temporal resolution. Since laser plasma x-ray source has high brightness and short pulse duration, x-ray microscope with the laser plasma x-ray source makes possible to observe living specimens. Such as chromosomes, macrophages, bacterium, and so on have been observed by contact x-ray microscopy. The x-ray images obtained by indirect measurements such as the contact x-ray microscopy have difficulty to avoid artificial effect such as irregular due to developing process. Development of an x-ray microscope with laser plasma x-ray source is necessary to avoid such defects. (author)

Reversible mechano-electrochemical writing of metallic nanostructures with the tip of an atomic force microscope

Directory of Open Access Journals (Sweden)

Christian Obermair

2012-12-01

Full Text Available We recently introduced a method that allows the controlled deposition of nanoscale metallic patterns at defined locations using the tip of an atomic force microscope (AFM as a “mechano-electrochemical pen”, locally activating a passivated substrate surface for site-selective electrochemical deposition. Here, we demonstrate the reversibility of this process and study the long-term stability of the resulting metallic structures. The remarkable stability for more than 1.5 years under ambient air without any observable changes can be attributed to self-passivation. After AFM-activated electrochemical deposition of copper nanostructures on a polycrystalline gold film and subsequent AFM imaging, the copper nanostructures could be dissolved by reversing the electrochemical potential. Subsequent AFM-tip-activated deposition of different copper nanostructures at the same location where the previous structures were deleted, shows that there is no observable memory effect, i.e., no effect of the previous writing process on the subsequent writing process. Thus, the four processes required for reversible information storage, “write”, “read”, “delete” and “re-write”, were successfully demonstrated on the nanometer scale.

Reversible mechano-electrochemical writing of metallic nanostructures with the tip of an atomic force microscope.

Science.gov (United States)

Obermair, Christian; Kress, Marina; Wagner, Andreas; Schimmel, Thomas

2012-01-01

We recently introduced a method that allows the controlled deposition of nanoscale metallic patterns at defined locations using the tip of an atomic force microscope (AFM) as a "mechano-electrochemical pen", locally activating a passivated substrate surface for site-selective electrochemical deposition. Here, we demonstrate the reversibility of this process and study the long-term stability of the resulting metallic structures. The remarkable stability for more than 1.5 years under ambient air without any observable changes can be attributed to self-passivation. After AFM-activated electrochemical deposition of copper nanostructures on a polycrystalline gold film and subsequent AFM imaging, the copper nanostructures could be dissolved by reversing the electrochemical potential. Subsequent AFM-tip-activated deposition of different copper nanostructures at the same location where the previous structures were deleted, shows that there is no observable memory effect, i.e., no effect of the previous writing process on the subsequent writing process. Thus, the four processes required for reversible information storage, "write", "read", "delete" and "re-write", were successfully demonstrated on the nanometer scale.

Atomic force microscope-assisted scanning tunneling spectroscopy under ambient conditions.

Science.gov (United States)

Vakhshouri, Amin; Hashimoto, Katsushi; Hirayama, Yoshiro

2014-12-01

We have developed a method of atomic force microscopy (AFM)-assisted scanning tunneling spectroscopy (STS) under ambient conditions. An AFM function is used for rapid access to a selected position prior to performing STS. The AFM feedback is further used to suppress vertical thermal drift of the tip-sample distance during spectroscopy, enabling flexible and stable spectroscopy measurements at room temperature. © The Author 2014. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oup.com.

Atomic Force Microscope Image Contrast Mechanisms on Supported Lipid Bilayers

OpenAIRE

Schneider, James; Dufrêne, Yves F.; Barger Jr., William R.; Lee, Gil U.

2000-01-01

This work presents a methodology to measure and quantitatively interpret force curves on supported lipid bilayers in water. We then use this method to correlate topographic imaging contrast in atomic force microscopy (AFM) images of phase-separated Langmuir-Blodgett bilayers with imaging load. Force curves collected on pure monolayers of both distearoylphosphatidylethanolamine (DSPE) and monogalactosylethanolamine (MGDG) and dioleoylethanolamine (DOPE) deposited at similar surface pressures o...

Development of a commercially viable piezoelectric force sensor system for static force measurement

Science.gov (United States)

Liu, Jun; Luo, Xinwei; Liu, Jingcheng; Li, Min; Qin, Lan

2017-09-01

A compensation method for measuring static force with a commercial piezoelectric force sensor is proposed to disprove the theory that piezoelectric sensors and generators can only operate under dynamic force. After studying the model of the piezoelectric force sensor measurement system, the principle of static force measurement using a piezoelectric material or piezoelectric force sensor is analyzed. Then, the distribution law of the decay time constant of the measurement system and the variation law of the measurement system’s output are studied, and a compensation method based on the time interval threshold Δ t and attenuation threshold Δ {{u}th} is proposed. By calibrating the system and considering the influences of the environment and the hardware, a suitable Δ {{u}th} value is determined, and the system’s output attenuation is compensated based on the Δ {{u}th} value to realize the measurement. Finally, a static force measurement system with a piezoelectric force sensor is developed based on the compensation method. The experimental results confirm the successful development of a simple compensation method for static force measurement with a commercial piezoelectric force sensor. In addition, it is established that, contrary to the current perception, a piezoelectric force sensor system can be used to measure static force through further calibration.

System for optical sorting of microscopic objects

DEFF Research Database (Denmark)

2014-01-01

The present invention relates to a system for optical sorting of microscopic objects and corresponding method. An optical detection system (52) is capable of determining the positions of said first and/or said second objects. One or more force transfer units (200, 205, 210, 215) are placed...... in a first reservoir, the one or more force units being suitable for optical momentum transfer. An electromagnetic radiation source (42) yields a radiation beam (31, 32) capable of optically displacing the force transfer units from one position to another within the first reservoir (1R). The force transfer...... units are displaced from positions away from the first objects to positions close to the first objects, and then displacing the first objects via a contact force (300) between the first objects and the force transfer units facilitates an optical sorting of the first objects and the second objects....

Tendon Force Transmission at the Nanoscale

DEFF Research Database (Denmark)

Svensson, René

2013-01-01

of connective tissue function that are poorly understood. One such aspect is the microscopic mechanisms of force transmission through tendons over macroscopic distances. Force transmission is at the heart of tendon function, but the large range of scales in the hierarchical structure of tendons has made...... it difficult to tackle. The tendon hierarchy ranges from molecules (2 nm) over fibrils (200 nm), fibers (2 μm) and fascicles (200 μm) to tendons (10 mm), and to derive the mechanisms of force transmission it is necessary to know the mechanical behavior at each hierarchical level. The aim of the present work...... was to elucidate the mechanisms of force transmission in tendons primarily by investigating the mechanical behavior at the hierarchical level of collagen fibrils. To do so we have developed an atomic force microscopy (AFM) method for tensile testing of native collagen fibrils. The thesis contains five papers...

Development of the water window imaging x-ray microscope

International Nuclear Information System (INIS)

Hoover, R.B.; Shealy, D.L.; Baker, P.C.; Barbee, T.W. Jr.; Walker, A.B.C. Jr.

1991-01-01

This paper reports on the Water Window Imaging X-ray Microscopy which is currently being developed by a consortium from the Marshall Space Flight Center, the University of Alabama at Birmingham, Baker Consulting, the Lawrence Livermore National Laboratory, and Stanford University. The high quality solar images achieved during the Stanford/MSFC/LLNL Rocket X-ray Spectroheliograph flight conclusively established that excellent imaging could be obtained with doubly reflecting multilayer optical systems. Theoretical studies carried out as part of the MSFC X-ray Microscopy Program, demonstrated that high quality, high resolution multilayer x-ray imaging microscopes could be achieved with spherical optics in the Schwarzschild configuration and with Aspherical optical systems. Advanced Flow Polishing methods have been used to fabricate substrates for multilayer optics. On hemlite grade Sapphire, the authors have achieved microscopy mirror substrates on concave and convex spherical surfaces with 0.5 Angstrom rms surface smoothness, as measured by the Zygo profilometer. In this paper the authors report on the current status of fabrication and testing of the optical and mechanical subsystems for the Water Window Imaging X-ray Microscope

Development of Scanning-Imaging X-Ray Microscope for Quantitative Three-Dimensional Phase Contrast Microimaging

International Nuclear Information System (INIS)

Takeuchi, Akihisa; Suzuki, Yoshio; Uesugi, Kentaro

2013-01-01

A novel x-ray microscope system has been developed for the purpose of quantitative and sensitive three-dimensional (3D) phase-contrast x-ray microimaging. The optical system is a hybrid that consists of a scanning microscope optics with a one-dimensional (1D) focusing (line-focusing) device and an imaging microscope optics with a 1D objective. These two optics are orthogonally arranged regarding their common optical axis. Each is used for forming each dimension of two-dimensional (2D) image. The same data acquisition process as that of the scanning microscope system enables quantitative and sensitive x-ray imaging such as phase contrast and absorption contrast. Because a 2D image is measured with only 1D translation scan, much shorter measurement time than that of conventional scanning optics has been realized. By combining a computed tomography (CT) technique, some 3D CT application examples are demonstrated

Capillary forces in tapping mode atomic force microscopy

NARCIS (Netherlands)

Zitzler, L.; Herminghaus, S.; Mugele, Friedrich Gunther

2002-01-01

We investigated the influence of the relative humidity on amplitude and phase of the cantilever oscillation while operating an atomic force microscope (AFM) in the tapping mode. If the free oscillation amplitude A0 exceeds a certain critical amplitude Ac, the amplitude- and phase-distance curves

Microelectromechanical system device for calibration of atomic force microscope cantilever spring constants between 0.01 and 4 N/m

International Nuclear Information System (INIS)

Cumpson, Peter J.; Hedley, John; Clifford, Charles A.; Chen Xinyong; Allen, Stephanie

2004-01-01

Calibration of atomic force microscope (AFM) cantilevers is necessary for the measurement of nano-newton and pico-newton forces, which are critical to analytical application of AFM in the analysis of polymer surfaces, biological structures and organic molecules. Previously we have described microfabricated array of reference spring (MARS) devices for AFM cantilever spring-constant calibration. Hitherto, these have been limited to the calibration of AFM cantilevers above 0.03 N/m, although they can be used to calibrate cantilevers of lower stiffness with reduced accuracy. Below this limit MARS devices similar to the designs hitherto described would be fragile and difficult to manufacture with reasonable yield. In this work we describe a device we call torsional MARS. This is a large-area torsional mechanical resonator, manufactured by bulk micromachining of a 'silicon-on-insulator' wafer. By measuring its torsional oscillation accurately in vacuum we can deduce its torsional spring constant. The torsional reference spring spans the range of spring constant (from 4 down to 0.01 N/m) that is important in biological AFM, allowing even the most compliant AFM cantilever to be calibrated easily and rapidly

Development of x-ray laminography under an x-ray microscopic condition

International Nuclear Information System (INIS)

Hoshino, Masato; Uesugi, Kentaro; Takeuchi, Akihisa; Suzuki, Yoshio; Yagi, Naoto

2011-01-01

An x-ray laminography system under an x-ray microscopic condition was developed to obtain a three-dimensional structure of laterally-extended planar objects which were difficult to observe by x-ray tomography. An x-ray laminography technique was introduced to an x-ray transmission microscope with zone plate optics. Three prototype sample holders were evaluated for x-ray imaging laminography. Layered copper grid sheets were imaged as a laminated sample. Diatomite powder on a silicon nitride membrane was measured to confirm the applicability of this method to non-planar micro-specimens placed on the membrane. The three-dimensional information of diatom shells on the membrane was obtained at a spatial resolution of sub-micron. Images of biological cells on the membrane were also obtained by using a Zernike phase contrast technique.

Probing thermal evanescent waves with a scattering-type near-field microscope

International Nuclear Information System (INIS)

Kajihara, Y; Kosaka, K; Komiyama, S

2011-01-01

Long wavelength infrared (LWIR) waves contain many important spectra of matters like molecular motions. Thus, probing spontaneous LWIR radiation without external illumination would reveal detailed mesoscopic phenomena that cannot be probed by any other measurement methods. Here we developed a scattering-type scanning near-field optical microscope (s-SNOM) and demonstrated passive near-field microscopy at 14.5 µm wavelength. Our s-SNOM consists of an atomic force microscope and a confocal microscope equipped with a highly sensitive LWIR detector, called a charge-sensitive infrared phototransistor (CSIP). In our s-SNOM, photons scattered by a tungsten probe are collected by an objective of the confocal LWIR microscope and are finally detected by the CSIP. To suppress the far-field background, we vertically modulated the probe and demodulated the signal with a lock-in amplifier. With the s-SNOM, a clear passive image of 3 µm pitch Au/SiC gratings was successfully obtained and the spatial resolution was estimated to be 60 nm (λ/240). The radiation from Au and GaAs was suggested to be due to thermally excited charge/current fluctuations and surface phonons, respectively. This s-SNOM has the potential to observe mesoscopic phenomena such as molecular motions, biomolecular protein interactions and semiconductor conditions in the future

Analysis of Zebrafish Kidney Development with Time-lapse Imaging Using a Dissecting Microscope Equipped for Optical Sectioning.

Science.gov (United States)

Perner, Birgit; Schnerwitzki, Danny; Graf, Michael; Englert, Christoph

2016-04-07

In order to understand organogenesis, the spatial and temporal alterations that occur during development of tissues need to be recorded. The method described here allows time-lapse analysis of normal and impaired kidney development in zebrafish embryos by using a fluorescence dissecting microscope equipped for structured illumination and z-stack acquisition. To visualize nephrogenesis, transgenic zebrafish (Tg(wt1b:GFP)) with fluorescently labeled kidney structures were used. Renal defects were triggered by injection of an antisense morpholino oligonucleotide against the Wilms tumor gene wt1a, a factor known to be crucial for kidney development. The advantage of the experimental setup is the combination of a zoom microscope with simple strategies for re-adjusting movements in x, y or z direction without additional equipment. To circumvent focal drift that is induced by temperature variations and mechanical vibrations, an autofocus strategy was applied instead of utilizing a usually required environmental chamber. In order to re-adjust the positional changes due to a xy-drift, imaging chambers with imprinted relocation grids were employed. In comparison to more complex setups for time-lapse recording with optical sectioning such as confocal laser scanning or light sheet microscopes, a zoom microscope is easy to handle. Besides, it offers dissecting microscope-specific benefits such as high depth of field and an extended working distance. The method to study organogenesis presented here can also be used with fluorescence stereo microscopes not capable of optical sectioning. Although limited for high-throughput, this technique offers an alternative to more complex equipment that is normally used for time-lapse recording of developing tissues and organ dynamics.

STM-SQUID probe microscope

International Nuclear Information System (INIS)

Hayashi, Tadayuki; Tachiki, Minoru; Itozaki, Hideo

2007-01-01

We have developed a STM-SQUID probe microscope. A high T C SQUID probe microscope was combined with a scanning tunneling microscope for investigation of samples at room temperature in air. A high permeability probe needle was used as a magnetic flux guide to improve the spatial resolution. The probe with tip radius of less than 100 nm was prepared by microelectropolishing. The probe was also used as a scanning tunneling microscope tip. Topography of the sample surface could be measured by the scanning tunneling microscope with high spatial resolution prior to observation by SQUID microscopy. The SQUID probe microscope image could be observed while keeping the distance from the sample surface to the probe tip constant. We observed a topographic image and a magnetic image of Ni fine pattern and also a magnetically recorded hard disk. Furthermore we have investigated a sample vibration method of the static magnetic field emanating from a sample with the aim of achieving a higher signal-to-noise (S/N) ratio

Development of the tunneling junction simulation environment for scanning tunneling microscope evaluation

International Nuclear Information System (INIS)

Gajewski, Krzysztof; Piasecki, Tomasz; Kopiec, Daniel; Gotszalk, Teodor

2017-01-01

Proper configuration of scanning tunneling microscope electronics plays an important role in the atomic scale resolution surface imaging. Device evaluation in the tunneling contact between scanning tip and sample may be prone to the surface quality or mechanical disturbances. Thus the use of tunneling junction simulator makes electronics testing more reliable and increases its repeatability. Here, we present the theoretical background enabling the proper selection of electronic components circuitry used as a tunneling junction simulator. We also show how to simulate mechanics related to the piezoelectric scanner, which is applied in real experiments. Practical use of the proposed simulator and its application in metrological characterization of the developed scanning tunneling microscope is also shown. (paper)

Descriptions of membrane mechanics from microscopic and effective two-dimensional perspectives

DEFF Research Database (Denmark)

Lomholt, Michael Andersen; Miao, L.

2006-01-01

Mechanics of fluid membranes may be described in terms of the concepts of mechanical deformations and stresses or in terms of mechanical free-energy functions. In this paper, each of the two descriptions is developed by viewing a membrane from two perspectives: a microscopic perspective, in which...... the membrane appears as a thin layer of finite thickness and with highly inhomogeneous material and force distributions in its transverse direction, and an effective, two-dimensional perspective, in which the membrane is treated as an infinitely thin surface, with effective material and mechanical properties....... A connection between these two perspectives is then established. Moreover, the functional dependence of the variation in the mechanical free energy of the membrane on its mechanical deformations is first studied in the microscopic perspective. The result is then used to examine to what extent different...

AN INTELLIGENT NEURO-FUZZY TERMINAL SLIDING MODE CONTROL METHOD WITH APPLICATION TO ATOMIC FORCE MICROSCOPE

Directory of Open Access Journals (Sweden)

Seied Yasser Nikoo

2016-11-01

Full Text Available In this paper, a neuro-fuzzy fast terminal sliding mode control method is proposed for controlling a class of nonlinear systems with bounded uncertainties and disturbances. In this method, a nonlinear terminal sliding surface is firstly designed. Then, this sliding surface is considered as input for an adaptive neuro-fuzzy inference system which is the main controller. A proportinal-integral-derivative controller is also used to asist the neuro-fuzzy controller in order to improve the performance of the system at the begining stage of control operation. In addition, bee algorithm is used in this paper to update the weights of neuro-fuzzy system as well as the parameters of the proportinal-integral-derivative controller. The proposed control scheme is simulated for vibration control in a model of atomic force microscope system and the results are compared with conventional sliding mode controllers. The simulation results show that the chattering effect in the proposed controller is decreased in comparison with the sliding mode and the terminal sliding mode controllers. Also, the method provides the advantages of fast convergence and low model dependency compared to the conventional methods.

The radial shapes of intermediate energy microscopic optical potentials

International Nuclear Information System (INIS)

Shen Qingbiao; Wang Chang; Tian Ye; Zhuo Yizhong

1984-01-01

The radial shapes of intermediate energy proton microscopic optical potentials of 40 Ca are calculated with nuclear matter approach by Skyrme interactions. The calculated results show that the real central potential in central region of nucleus changes from attractive to repulsive when the energy of incident nucleon is above 150 MeV and appears apparently a 'wine-bottle-bottom' shape in the transition energy region (from 150 MeV to 300 MeV). This tendency is consistent with empirical optical potential obtained through fitting experiments and microscopic optical potential calculated with relativistic mean field theory as well as with the BHF theory. The calculated imaginary part of the microscopic optical potential changes from the dominant surface absorption into the volume absorption and its absolute value become larger as energy increases. The effects of Skyrme force parameters to the radial shape of the calculated microscopic optical potential are analysed in detail

Dispersion Forces

CERN Document Server

Buhmann, Stefan Yoshi

2012-01-01

In this book, a modern unified theory of dispersion forces on atoms and bodies is presented which covers a broad range of advanced aspects and scenarios. Macroscopic quantum electrodynamics is shown to provide a powerful framework for dispersion forces which allows for discussing general properties like their non-additivity and the relation between microscopic and macroscopic interactions. It is demonstrated how the general results can be used to obtain dispersion forces on atoms in the presence of bodies of various shapes and materials. Starting with a brief recapitulation of volume I, this volume II deals especially with bodies of irregular shapes, universal scaling laws, dynamical forces on excited atoms, enhanced forces in cavity quantum electrodynamics, non-equilibrium forces in thermal environments and quantum friction. The book gives both the specialist and those new to the field a thorough overview over recent results in the field. It provides a toolbox for studying dispersion forces in various contex...

Cometary dust at the smallest scale - latest results of the MIDAS Atomic Force Microscope onboard Rosetta

Science.gov (United States)

Bentley, Mark; Torkar, Klaus; Jeszenszky, Harald; Romstedt, Jens; Schmied, Roland; Mannel, Thurid

2015-04-01

The MIDAS instrument onboard the Rosetta orbit is a unique combination of a dust collection and handling system and a high resolution Atomic Force Microscope (AFM). By building three-dimensional images of the dust particle topography, MIDAS addresses a range of fundamental questions in Solar System and cometary science. The first few months of dust collection and scanning revealed a deficit of smaller (micron and below) particles but eventually several 10 µm-class grains were discovered. In fact these were unexpectedly large and close to the limit of what is observable with MIDAS. As a result the sharp tip used by the AFM struck the particles from the side, causing particle breakage and distortion. Analyses so far suggest that the collected particles are fluffy aggregates of smaller sub-units, although determination of the size of these sub-units and high resolution re-imaging remains to be done. The latest findings will be presented here, including a description of the particles collected and the implications of these observations for cometary science and the Rosetta mission at comet 67P.

A control approach to cross-coupling compensation of piezotube scanners in tapping-mode atomic force microscope imaging.

Science.gov (United States)

Wu, Ying; Shi, Jian; Su, Chanmin; Zou, Qingze

2009-04-01

In this article, an approach based on the recently developed inversion-based iterative control (IIC) to cancel the cross-axis coupling effect of piezoelectric tube scanners (piezoscanners) in tapping-mode atomic force microscope (AFM) imaging is proposed. Cross-axis coupling effect generally exists in piezoscanners used for three-dimensional (x-y-z axes) nanopositioning in applications such as AFM, where the vertical z-axis movement can be generated by the lateral x-y axes scanning. Such x/y-to-z cross-coupling becomes pronounced when the scanning is at large range and/or at high speed. In AFM applications, the coupling-caused position errors, when large, can generate various adverse effects, including large imaging and topography distortions, and damage of the cantilever probe and/or the sample. This paper utilizes the IIC technique to obtain the control input to precisely track the coupling-caused x/y-to-z displacement (with sign-flipped). Then the obtained input is augmented as a feedforward control to the existing feedback control in tapping-mode imaging, resulting in the cancellation of the coupling effect. The proposed approach is illustrated through two exemplary applications in industry, the pole-tip recession examination, and the nanoasperity measurement on hard-disk drive. Experimental results show that the x/y-to-z coupling effect in large-range (20 and 45 microm) tapping-mode imaging at both low to high scan rates (2, 12.2 to 24.4 Hz) can be effectively removed.

Robotic autopositioning of the operating microscope.

Science.gov (United States)

Oppenlander, Mark E; Chowdhry, Shakeel A; Merkl, Brandon; Hattendorf, Guido M; Nakaji, Peter; Spetzler, Robert F

2014-06-01

Use of the operating microscope has become pervasive since its introduction to the neurosurgical world. Neuronavigation fused with the operating microscope has allowed accurate correlation of the focal point of the microscope and its location on the downloaded imaging study. However, the robotic ability of the Pentero microscope has not been utilized to orient the angle of the microscope or to change its focal length to hone in on a predefined target. To report a novel technology that allows automatic positioning of the operating microscope onto a set target and utilization of a planned trajectory, either determined with the StealthStation S7 by using preoperative imaging or intraoperatively with the microscope. By utilizing the current motorized capabilities of the Zeiss OPMI Pentero microscope, a robotic autopositioning feature was developed in collaboration with Surgical Technologies, Medtronic, Inc. (StealthStation S7). The system is currently being tested at the Barrow Neurological Institute. Three options were developed for automatically positioning the microscope: AutoLock Current Point, Align Parallel to Plan, and Point to Plan Target. These options allow the microscope to pivot around the lesion, hover in a set plane parallel to the determined trajectory, or rotate and point to a set target point, respectively. Integration of automatic microscope positioning into the operative workflow has potential to increase operative efficacy and safety. This technology is best suited for precise trajectories and entry points into deep-seated lesions.

Nonequilibrium Distribution of the Microscopic Thermal Current in Steady Thermal Transport Systems

KAUST Repository

Yukawa, Satoshi; Ogushi, Fumiko; Shimada, Takashi; Ito, Nobuyasu

2010-01-01

Nonequilibrium distribution of the microscopic thermal current is investigated by direct molecular dynamics simulations. The microscopic thermal current in this study is defined by a flow of kinetic energy carried by a single particle. Asymptotic parallel and antiparallel tails of the nonequilibrium distribution to an average thermal current are identical to ones of equilibrium distribution with different temperatures. These temperatures characterizing the tails are dependent on a characteristic length in which a memory of dynamics is completely erased by several particle collisions. This property of the tails of nonequilibrium distribution is confirmed in other thermal transport systems. In addition, statistical properties of a particle trapped by a harmonic potential in a steady thermal conducting state are also studied. This particle feels a finite force parallel to the average thermal current as a consequence of the skewness of the distribution of the current. This force is interpreted as the microscopic origin of thermophoresis.

Microscopic picture of the aqueous solvation of glutamic acid

NARCIS (Netherlands)

Leenders, E.J.M.; Bolhuis, P.G.; Meijer, E.J.

2008-01-01

We present molecular dynamics simulations of glutamic acid and glutamate solvated in water, using both density functional theory (DFT) and the Gromos96 force field. We focus on the microscopic aspects of the solvation−particularly on the hydrogen bond structures and dynamics−and investigate the

Development of a detachable high speed miniature scanning probe microscope for large area substrates inspection

Energy Technology Data Exchange (ETDEWEB)

Sadeghian, Hamed, E-mail: hamed.sadeghianmarnani@tno.nl, E-mail: h.sadeghianmarnani@tudelft.nl [Department of Optomechatronics, Netherlands Organization for Scientific Applied Research, TNO, Stieltjesweg 1, 2628 CK Delft (Netherlands); Department of Precision and Microsystems Engineering, Delft University of Technology, Mekelweg 2, 2628 CD Delft (Netherlands); Herfst, Rodolf; Winters, Jasper; Crowcombe, Will; Kramer, Geerten; Dool, Teun van den; Es, Maarten H. van [Department of Optomechatronics, Netherlands Organization for Scientific Applied Research, TNO, Stieltjesweg 1, 2628 CK Delft (Netherlands)

2015-11-15

We have developed a high speed, miniature scanning probe microscope (MSPM) integrated with a Positioning Unit (PU) for accurately positioning the MSPM on a large substrate. This combination enables simultaneous, parallel operation of many units on a large sample for high throughput measurements. The size of the MSPM is 19 × 45 × 70 mm{sup 3}. It contains a one-dimensional flexure stage with counter-balanced actuation for vertical scanning with a bandwidth of 50 kHz and a z-travel range of more than 2 μm. This stage is mechanically decoupled from the rest of the MSPM by suspending it on specific dynamically determined points. The motion of the probe, which is mounted on top of the flexure stage is measured by a very compact optical beam deflection (OBD). Thermal noise spectrum measurements of short cantilevers show a bandwidth of 2 MHz and a noise of less than 15 fm/Hz{sup 1/2}. A fast approach and engagement of the probe to the substrate surface have been achieved by integrating a small stepper actuator and direct monitoring of the cantilever response to the approaching surface. The PU has the same width as the MSPM, 45 mm and can position the MSPM to a pre-chosen position within an area of 275×30 mm{sup 2} to within 100 nm accuracy within a few seconds. During scanning, the MSPM is detached from the PU which is essential to eliminate mechanical vibration and drift from the relatively low-resonance frequency and low-stiffness structure of the PU. Although the specific implementation of the MSPM we describe here has been developed as an atomic force microscope, the general architecture is applicable to any form of SPM. This high speed MSPM is now being used in a parallel SPM architecture for inspection and metrology of large samples such as semiconductor wafers and masks.

Development of an environmental high-voltage electron microscope for reaction science.

Science.gov (United States)

Tanaka, Nobuo; Usukura, Jiro; Kusunoki, Michiko; Saito, Yahachi; Sasaki, Katuhiro; Tanji, Takayoshi; Muto, Shunsuke; Arai, Shigeo

2013-02-01

Environmental transmission electron microscopy and ultra-high resolution electron microscopic observation using aberration correctors have recently emerged as topics of great interest. The former method is an extension of the so-called in situ electron microscopy that has been performed since the 1970s. Current research in this area has been focusing on dynamic observation with atomic resolution under gaseous atmospheres and in liquids. Since 2007, Nagoya University has been developing a new 1-MV high voltage (scanning) transmission electron microscope that can be used to observe nanomaterials under conditions that include the presence of gases, liquids and illuminating lights, and it can be also used to perform mechanical operations to nanometre-sized areas as well as electron tomography and elemental analysis by electron energy loss spectroscopy. The new instrument has been used to image and analyse various types of samples including biological ones.

Magnet polepiece design for uniform magnetic force on superparamagnetic beads

OpenAIRE

Fallesen, Todd; Hill, David B.; Steen, Matthew; Macosko, Jed C.; Bonin, Keith; Holzwarth, George

2010-01-01

Here we report construction of a simple electromagnet with novel polepieces which apply a spatially uniform force to superparamagnetic beads in an optical microscope. The wedge-shaped gap was designed to keep ∂Bx∕∂y constant and B large enough to saturate the bead. We achieved fields of 300–600 mT and constant gradients of 67 T∕m over a sample space of 0.5×4 mm2 in the focal plane of the microscope and 0.05 mm along the microscope optic axis. Within this space the maximum force on a 2.8 μm di...

Measurement of friction force between two mica surfaces with multiple beam interferometry

Directory of Open Access Journals (Sweden)

Jung J.C.

2010-06-01

Full Text Available Friction forces play a crucial role in the tribological behaviour of microcomponents and the application of MEMS products. It is necessary to develop a measurement system to understand and control the material characteristics. In this study, a microscopic measurement system based on multiple beam interferometry is developed to measure the friction force between two mica thin films. Some frictional behaviour between the two mica sheets in contact are reported. The evaluated shear strength of mica agrees well to the existing data. It is possible to use the developed system for micro-tribology study.

21 CFR 884.6190 - Assisted reproductive microscopes and microscope accessories.

Science.gov (United States)

2010-04-01

... 21 Food and Drugs 8 2010-04-01 2010-04-01 false Assisted reproductive microscopes and microscope... Devices § 884.6190 Assisted reproductive microscopes and microscope accessories. (a) Identification. Assisted reproduction microscopes and microscope accessories (excluding microscope stage warmers, which are...

Apoptosis study of the macrophage via near-field scanning optical microscope

International Nuclear Information System (INIS)

Wang, D-C; Chen, K-Y; Chen, G-Y; Chen, S-H; Wun, S-J

2008-01-01

The cell apoptosis phenomenon was studied by traditional optical microscope with much lower resolution and also observed by Atomic Force Microscope (AFM) with nano-resolution recently. They both detect the cell apoptosis through the change of cell topography. In this study, the cell apoptosis was investigated via Near-Field Scanning Optical Microscope (NSOM). The cell topography, with nano-scaled resolution, and its optical characteristics were observed by NSOM at the same measurement scanning. The macrophage was chosen as the cell investigated. To understand the cell apoptosis process is the goal set for the research. The apoptosis process was related to the variations of the optical characteristics of the cell

Neuromuscular rate of force development deficit in Parkinson disease.

Science.gov (United States)

Hammond, Kelley G; Pfeiffer, Ronald F; LeDoux, Mark S; Schilling, Brian K

2017-06-01

Bradykinesia and reduced neuromuscular force exist in Parkinson disease. The interpolated twitch technique has been used to evaluate central versus peripheral manifestations of neuromuscular strength in healthy, aging, and athletic populations, as well as moderate to advanced Parkinson disease, but this method has not been used in mild Parkinson disease. This study aimed to evaluate quadriceps femoris rate of force development and quantify potential central and peripheral activation deficits in individuals with Parkinson disease. Nine persons with mild Parkinson Disease (Hoehn & Yahr≤2, Unified Parkinson Disease Rating Scale total score=mean 19.1 (SD 5.0)) and eight age-matched controls were recruited in a cross-sectional investigation. Quadriceps femoris voluntary and stimulated maximal force and rate of force development were evaluated using the interpolated twitch technique. Thirteen participants satisfactorily completed the protocol. Individuals with early Parkinson disease (n=7) had significantly slower voluntary rate of force development (p=0.008; d=1.97) and rate of force development ratio (p=0.004; d=2.18) than controls (n=6). No significant differences were found between groups for all other variables. Persons with mild-to-moderate Parkinson disease display disparities in rate of force development, even without deficits in maximal force. The inability to produce force at a rate comparable to controls is likely a downstream effect of central dysfunction of the motor pathway in Parkinson disease. Copyright © 2017. Published by Elsevier Ltd.

Quantifying Hydrostatic Pressure in Plant Cells by Using Indentation with an Atomic Force Microscope

Science.gov (United States)

Beauzamy, Léna; Derr, Julien; Boudaoud, Arezki

2015-01-01

Plant cell growth depends on a delicate balance between an inner drive—the hydrostatic pressure known as turgor—and an outer restraint—the polymeric wall that surrounds a cell. The classical technique to measure turgor in a single cell, the pressure probe, is intrusive and cannot be applied to small cells. In order to overcome these limitations, we developed a method that combines quantification of topography, nanoindentation force measurements, and an interpretation using a published mechanical model for the pointlike loading of thin elastic shells. We used atomic force microscopy to estimate the elastic properties of the cell wall and turgor pressure from a single force-depth curve. We applied this method to onion epidermal peels and quantified the response to changes in osmolality of the bathing solution. Overall our approach is accessible and enables a straightforward estimation of the hydrostatic pressure inside a walled cell. PMID:25992723

Nanopuller-open data acquisition platform for AFM force spectroscopy experiments

International Nuclear Information System (INIS)

Pawlak, Konrad; Strzelecki, Janusz

2016-01-01

Atomic Force Microscope (AFM) is a widely used tool in force spectroscopy studies. Presently, this instrument is accessible from numerous vendors, albeit commercial solutions are expensive and almost always hardware and software closed. Approaches for open setups were published, as with modern low cost and readily available piezoelectric actuators, data acquisition interfaces and optoelectronic components building such force spectroscopy AFM is relatively easy. However, suitable software to control such laboratory made instrument was not released. Developing it in the lab requires significant time and effort. Our Nanopuller software described in this paper is intended to eliminate this obstacle. With only minimum adjustments this program can be used to control and acquire data with any suitable National Instruments universal digital/analog interface and piezoelectric actuator analog controller, giving significant freedom and flexibility in designing force spectroscopy experiment. Since the full code, written in a graphical LabVIEW environment is available, our Nanopuller can be easily customized. In this paper we describe the program and test its performance in controlling different setups. Successful and accurate force curve acquisition for standard samples (single molecules of I27O reference titin polyprotein and DNA as well as red blood cells) is shown. - Highlights: • We created open data acquisition software for performing Atomic Force Microscopy force measurements with custom laboratory made setups. • The software allows large flexibility in atomic force microscope design with minimum adjustment necessary. • The software is written in LabVIEW, allowing easy customization. • We successfully tested the program on two different hardware configurations by stretching single macromolecules and indenting cells.

Nanopuller-open data acquisition platform for AFM force spectroscopy experiments

Energy Technology Data Exchange (ETDEWEB)

Pawlak, Konrad; Strzelecki, Janusz

2016-05-15

Atomic Force Microscope (AFM) is a widely used tool in force spectroscopy studies. Presently, this instrument is accessible from numerous vendors, albeit commercial solutions are expensive and almost always hardware and software closed. Approaches for open setups were published, as with modern low cost and readily available piezoelectric actuators, data acquisition interfaces and optoelectronic components building such force spectroscopy AFM is relatively easy. However, suitable software to control such laboratory made instrument was not released. Developing it in the lab requires significant time and effort. Our Nanopuller software described in this paper is intended to eliminate this obstacle. With only minimum adjustments this program can be used to control and acquire data with any suitable National Instruments universal digital/analog interface and piezoelectric actuator analog controller, giving significant freedom and flexibility in designing force spectroscopy experiment. Since the full code, written in a graphical LabVIEW environment is available, our Nanopuller can be easily customized. In this paper we describe the program and test its performance in controlling different setups. Successful and accurate force curve acquisition for standard samples (single molecules of I27O reference titin polyprotein and DNA as well as red blood cells) is shown. - Highlights: • We created open data acquisition software for performing Atomic Force Microscopy force measurements with custom laboratory made setups. • The software allows large flexibility in atomic force microscope design with minimum adjustment necessary. • The software is written in LabVIEW, allowing easy customization. • We successfully tested the program on two different hardware configurations by stretching single macromolecules and indenting cells.

FRAME (Force Review Automation Environment): MATLAB-based AFM data processor.

Science.gov (United States)

Partola, Kostyantyn R; Lykotrafitis, George

2016-05-03

Data processing of force-displacement curves generated by atomic force microscopes (AFMs) for elastic moduli and unbinding event measurements is very time consuming and susceptible to user error or bias. There is an evident need for consistent, dependable, and easy-to-use AFM data processing software. We have developed an open-source software application, the force review automation environment (or FRAME), that provides users with an intuitive graphical user interface, automating data processing, and tools for expediting manual processing. We did not observe a significant difference between manually processed and automatically processed results from the same data sets. Copyright © 2016 Elsevier Ltd. All rights reserved.

Topotactic changes on η-Mo4O11 caused by biased atomic force microscope tip and cw-laser

International Nuclear Information System (INIS)

Borovšak, Miloš; Šutar, Petra; Goreshnik, Evgeny; Mihailovic, Dragan

2015-01-01

Highlights: • We report influencing electronic properties of η-Mo 4 O 11 . • With the biased AFM tip we induce the surface potential changes on η-Mo 4 O 11 . • We used cw-laser to induced similar effect on surface potential on η-Mo 4 O 11 . • We do not influence the surface and topography of the samples. • No change in topography of samples indicates the topotactic transformation. - Abstract: We present topotactic changes on Mo 4 O 11 crystals induced by a biased atomic force microscope tip and continuous laser. The transformation does not change the topography of the samples, while the surface potential shows remarkable changes on areas where the biased AFM tip was applied. No structural changes were observed by Raman spectroscopy, but AFM scans revealed changes to surface potential due to laser illumination. The observed phenomenon could be potentially useful for memristive memory devices considering the fact that properties of other molybdenum oxides vary from metallic to insulators.

Spin rotation function in a microscopic non-relativistic optical model

International Nuclear Information System (INIS)

Bauhoff, W.

1984-01-01

A microscopic optical potential, which is calculated non-relativistically with a density-dependent effective force, is used to calculate cross-section, polarization and spin-rotation function for elastic proton scattering from 40 Ca at 160 MeV and 497 MeV. At 160 MeV, the agreement to the data is comparable to phenomenological fits, and the spin-rotation can be used to distinguish between microscopic and Woods-Saxon potentials. A good fit to the spin-rotation function results at 497 MeV, whereas the polarization data are not well reproduced

Massively Parallel Single-Molecule Manipulation Using Centrifugal Force

Science.gov (United States)

Wong, Wesley; Halvorsen, Ken

2011-03-01

Precise manipulation of single molecules has led to remarkable insights in physics, chemistry, biology, and medicine. However, two issues that have impeded the widespread adoption of these techniques are equipment cost and the laborious nature of making measurements one molecule at a time. To meet these challenges, we have developed an approach that enables massively parallel single- molecule force measurements using centrifugal force. This approach is realized in the centrifuge force microscope, an instrument in which objects in an orbiting sample are subjected to a calibration-free, macroscopically uniform force- field while their micro-to-nanoscopic motions are observed. We demonstrate high- throughput single-molecule force spectroscopy with this technique by performing thousands of rupture experiments in parallel, characterizing force-dependent unbinding kinetics of an antibody-antigen pair in minutes rather than days. Currently, we are taking steps to integrate high-resolution detection, fluorescence, temperature control and a greater dynamic range in force. With significant benefits in efficiency, cost, simplicity, and versatility, single-molecule centrifugation has the potential to expand single-molecule experimentation to a wider range of researchers and experimental systems.

Nanoparticle movement: Plasmonic forces and physical constraints

International Nuclear Information System (INIS)

Batson, P.E.; Reyes-Coronado, A.; Barrera, R.G.; Rivacoba, A.; Echenique, P.M.; Aizpurua, J.

2012-01-01

Nanoparticle structures observed in aberration-corrected electron microscopes exhibit many types of behavior, some of which are dominated by intrinsic conditions, unrelated to the microscope environment. Some behaviors are clearly driven by the electron beam, however, and the question arises as to whether these are similar to intrinsic mechanisms, useful for understanding nanoscale behavior, or whether they should be regarded as unwanted modification of as-built specimens. We have studied a particular kind of beam–specimen interaction – plasmon dielectric forces caused by the electric fields imposed by a passing swift electron – identifying four types of forced motion, including both attractive and repulsive forces on single nanoparticles, and coalescent and non-coalescent forces in groups of two or more nanoparticles. We suggest that these forces might be useful for deliberate electron beam guided movement of nanoparticles. -- Highlights: ► We investigate the interaction of metal nanoparticles with a high energy electron beam. ► We find forces ranging from 0.1 to 50 pN forces between the metal particles and the beam. ► At moderate distances, dielectric forces are usually small and attractive. ► At sub-Nm distances the forces become repulsive, pushing nanoparticles away from the electron beam. ► While the repulsive behavior is predicted by electromagnetic theory, the detailed origin of the behavior is not yet understood.

Mobile microscope complex GIB-1

International Nuclear Information System (INIS)

Belyakov, A.V.; Gorbachev, A.N.

2002-01-01

To study microstructure in operating pipelines of power units a mobile microscope system is developed and successfully used. The system includes a portable microscope, a monitor, power supply and a portable computer. The monitor is used for surveying images from a video camera mounted on the microscope. The magnification on visual examination constitutes x 100 and x 500. Diameters of pipelines examined should not be less than 130 mm. Surface preparation for microstructural studies includes routine mechanical rough grinding and polishing with subsequent etching [ru

Physical chemistry and microscopic characteristics of matured beef peccary (Tayassu tajacu

Directory of Open Access Journals (Sweden)

Hugo Rangel Fernandes

2015-06-01

Full Text Available ABSTRACT. Fernandes H.R., Oliveira L.C., Ribeiro S.C.A. & Lourenço L.F.H. [Physical chemistry and microscopic characteristics of matured beef peccary (Tayassu tajacu.] Características físicas e microscópicas da carne maturada de caititu (Tayassu tajacu. Revista Brasileira de Medicina Veterinária, 37(2:167-172, 2015. Universidade do Estado do Pará, Travessa Enéas Pinheiro, 2626, Marco, Belém, PA 66113-200, Brasil. Email: suziar@yahoo.com The objective of this article was to analyze the physical and microscopic matured beef peccary. Were performed analyses of shear force, water holding capacity, weight loss by cooking and scanning electron microscopy in matured beef. The matured beef presented values of shear force between 3.76 and 5.26 %, water activity between 0,96 to 0,98 and weight loss by cooking between 19,46 and 21,17%. Therefore, it was found that the matured beef peccary, were considered soft according to analysis of shear force. The matured beef at 0ºC for 12 days was considered the best product for having less weight loss by cooking and softness according to analysis of shear force and scanning electron microscopy.

Study of Adhesion Interaction Using Atomic Force Microscopy

Science.gov (United States)

Grybos, J.; Pyka-Fosciak, G.; Lebed, K.; Lekka, M.; Stachura, Z.; Styczeñ, J.

2003-05-01

An atomic force microscope is a useful tool to study the interaction forces at molecular level. In particular the atomic force microscope can measure an unbinding force needed to separate the two single molecule complexes. Recent studies have shown that such unbinding force depends linearly on the logarithm of the applied loading rate, defined as a product of scanning velocity and the spring constant characterizing the investigated system (cantilever vs. surface). This dependence can be used to study the energy landscape shape of a molecular complex by the estimation of energy barrier locations and the related dissociation rates. In the present work the complex consisting of ethylene(di)aminetetraacetic acid and the bovine serum albumin was measured. The dependence between the unbinding force and the logarithm of the loading rate was linear. Using the Bell model describing the dissociation of the above molecules caused by the action of the external bond breaking force, two parameters were estimated: the dissociation rate and the position of the energy barrier needed to overcome during a transition from a bound to unbound state. The obtained results are similar to those obtained for a typical ligand--receptor interaction.

Female labor force participation in developing countries

OpenAIRE

Verick, Sher

2014-01-01

While women’s labor force participation tends to increase with economic development, the relationship is not straightforward or consistent at the country level. There is considerably more variation across developing countries in labor force participation by women than by men. This variation is driven by a wide variety of economic and social factors, which include economic growth, education, and social norms. Looking more broadly at improving women’s access to quality employment, a critica...

Collaborative Research and Development. Delivery Order 0006: Transmission Electron Microscope Image Modeling and Semiconductor Heterointerface Characterization

National Research Council Canada - National Science Library

Mahalingam, Krishnamurthy

2006-01-01

.... Transmission electron microscope (TEM) characterization studies were performed on a variety of novel III-V semiconductor heterostructures being developed for advanced optoelectronic device applications...

IMIS: An intelligence microscope imaging system

Science.gov (United States)

Caputo, Michael; Hunter, Norwood; Taylor, Gerald

1994-01-01

Until recently microscope users in space relied on traditional microscopy techniques that required manual operation of the microscope and recording of observations in the form of written notes, drawings, or photographs. This method was time consuming and required the return of film and drawings from space for analysis. No real-time data analysis was possible. Advances in digital and video technologies along with recent developments in article intelligence will allow future space microscopists to have a choice of three additional modes of microscopy: remote coaching, remote control, and automation. Remote coaching requires manual operations of the microscope with instructions given by two-way audio/video transmission during critical phases of the experiment. When using the remote mode of microscopy, the Principal Investigator controls the microscope from the ground. The automated mode employs artificial intelligence to control microscope functions and is the only mode that can be operated in the other three modes as well. The purpose of this presentation is to discuss the advantages and disadvantages of the four modes of of microscopy and how the IMIS, a proposed intelligent microscope imaging system, can be used as a model for developing and testing concepts, operating procedures, and equipment design of specifications required to provide a comprehensive microscopy/imaging capability onboard Space Station Freedom.

Literature survey on microscopic friction modeling

NARCIS (Netherlands)

Hol, J.

2010-01-01

To better understand contact and friction conditions, experimental and theoretical studies have been performed in order to take microscopic dependencies into account. Friction is developed on microscopic level by adhesion between contacting asperities, the ploughing effect between asperities and the

Development And Use Of Advanced Microfabricated Traction Force Sensing Substrates To Study The Effect of Nanosilver On Human Macrophages

Science.gov (United States)

Stark, Daniel Thomas

While nanoparticles are a natural byproduct of combustion and a number of natural processes, engineered nanoparticles have only recently entered the consumer market. This motivates the development of methods for studying their effects on human cells, thereby indicating how larger models such as animals and humans might react to them. This research develops a method to mechanically characterize cellular traction forces as a measure of exposure to nanoparticles. To do this, 1microm micropillar molds were fabricated in silicon wafers using smooth sidewall reactive ion plasma etching technologies. Polydimethylsiloxane (PDMS), was cured inside the silicon molds, subsequently treated for cell culture and used to measure cellular traction forces over time in live cell time-lapse experiments. For the first time, transmitted light was used to visualize the PDMS micropillars; a force resolution of 5.6 +/-2.1nN was achieved across all experiments using a standard Olympus IX81 confocal microscope affixed with a 60x NA2.1 objective. To initiate cellular movement, monocyte chemoattractant protein (MCP-1) was conjugated to 1microm latex beads. The effects of 40nm silver nanoparticle exposures were quantified using the micropillar array. Changes in cellular behavior between the control group and cells exposed to nanosilver were not significant, although a comparison between the 5microg/ml and 10microg/ml nanosilver concentrations yielded strong significance using a 2 sided Students t test.

An Atomic Force Microscopical Study of the Synaptonemal Complex

NARCIS (Netherlands)

Putman, C.A.J.; Putman, C.A.J.; Dietrich, A.J.J.; de Grooth, B.G.; van Marle, J.; Heyting, C.; van Hulst, N.F.; Greve, Jan

1993-01-01

The chromosomal structure which is specific for meiosis, the synaptonemal complex (SC), plays a major role in chromosome pairing and the recombination of genetic material. The SC was studied using atomic force microscopy (AFM). The results of this study confirm the results of light and electron

Manipulation of nanoparticles of different shapes inside a scanning electron microscope

Directory of Open Access Journals (Sweden)

Boris Polyakov

2014-02-01

Full Text Available In this work polyhedron-like gold and sphere-like silver nanoparticles (NPs were manipulated on an oxidized Si substrate to study the dependence of the static friction and the contact area on the particle geometry. Measurements were performed inside a scanning electron microscope (SEM that was equipped with a high-precision XYZ-nanomanipulator. To register the occurring forces a quartz tuning fork (QTF with a glued sharp probe was used. Contact areas and static friction forces were calculated by using different models and compared with the experimentally measured force. The effect of NP morphology on the nanoscale friction is discussed.

Development of a SEM-based low-energy in-line electron holography microscope for individual particle imaging.

Science.gov (United States)

Adaniya, Hidehito; Cheung, Martin; Cassidy, Cathal; Yamashita, Masao; Shintake, Tsumoru

2018-05-01

A new SEM-based in-line electron holography microscope has been under development. The microscope utilizes conventional SEM and BF-STEM functionality to allow for rapid searching of the specimen of interest, seamless interchange between SEM, BF-STEM and holographic imaging modes, and makes use of coherent low-energy in-line electron holography to obtain low-dose, high-contrast images of light element materials. We report here an overview of the instrumentation and first experimental results on gold nano-particles and carbon nano-fibers for system performance tests. Reconstructed images obtained from the holographic imaging mode of the new microscope show substantial image contrast and resolution compared to those acquired by SEM and BF-STEM modes, demonstrating the feasibility of high-contrast imaging via low-energy in-line electron holography. The prospect of utilizing the new microscope to image purified biological specimens at the individual particle level is discussed and electron optical issues and challenges to further improve resolution and contrast are considered. Copyright © 2018 Elsevier B.V. All rights reserved.

The application of force-sensing resistor sensors for measuring forces developed by the human hand.

Science.gov (United States)

Nikonovas, A; Harrison, A J L; Hoult, S; Sammut, D

2004-01-01

Most attempts to measure forces developed by the human hand have been implemented by placing force sensors on the object of interaction. Other researchers have placed sensors just on the subject's fingertips. In this paper, a system is described that measures forces over the entire hand using thin-film sensors and associated electronics. This system was developed by the authors and is able to obtain force readings from up to 60 thin-film sensors at rates of up to 400 samples/s per sensor. The sensors can be placed anywhere on the palm and/or fingers of the hand. The sensor readings, together with a video stream containing information about hand posture, are logged into a portable computer using a multiplexer, analogue-to-digital converter and software developed for the purpose. The system has been successfully used to measure forces involved in a range of everyday tasks such as driving a vehicle, lifting saucepans and hitting a golf ball. In the latter case, results are compared with those from an instrumented golf club. Future applications include the assessment of hand strength following disease, trauma or surgery, and to enable quantitative ergonomic investigations.

Implementing and Quantifying the Shape-Memory Effect of Single Polymeric Micro/Nanowires with an Atomic Force Microscope.

Science.gov (United States)

Fang, Liang; Gould, Oliver E C; Lysyakova, Liudmila; Jiang, Yi; Sauter, Tilman; Frank, Oliver; Becker, Tino; Schossig, Michael; Kratz, Karl; Lendlein, Andreas

2018-04-23

The implementation of shape-memory effects (SME) in polymeric micro- or nano-objects currently relies on the application of indirect macroscopic manipulation techniques, for example, stretchable molds or phantoms, to ensembles of small objects. Here, we introduce a method capable of the controlled manipulation and SME quantification of individual micro- and nano-objects in analogy to macroscopic thermomechanical test procedures. An atomic force microscope was utilized to address individual electro-spun poly(ether urethane) (PEU) micro- or nanowires freely suspended between two micropillars on a micro-structured silicon substrate. In this way, programming strains of 10±1% or 21±1% were realized, which could be successfully fixed. An almost complete restoration of the original free-suspended shape during heating confirmed the excellent shape-memory performance of the PEU wires. Apparent recovery stresses of σ max,app =1.2±0.1 and 33.3±0.1 MPa were obtained for a single microwire and nanowire, respectively. The universal AFM test platform described here enables the implementation and quantification of a thermomechanically induced function for individual polymeric micro- and nanosystems. © 2018 Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim.

Electron microscope studies

International Nuclear Information System (INIS)

Crewe, A.V.; Kapp, O.H.

1992-01-01

This is a report covering the research performed in the Crewe laboratory between 1964 and 1992. Because of limitations of space we have provided relatively brief summaries of the major research directions of the facility during these years. A complete bibliography has been included and we have referenced groups of pertinent publications at the beginning of each section. This report summarizes our efforts to develop better electron microscopes and chronicles many of the experimental programs, in materials science and biology, that acted both as a stimulus to better microscope design and also as a testing ground for many instrumental innovations

Electron microscope studies

Energy Technology Data Exchange (ETDEWEB)

Crewe, A.V.; Kapp, O.H.

1992-07-01

This is a report covering the research performed in the Crewe laboratory between 1964 and 1992. Because of limitations of space we have provided relatively brief summaries of the major research directions of the facility during these years. A complete bibliography has been included and we have referenced groups of pertinent publications at the beginning of each section. This report summarizes our efforts to develop better electron microscopes and chronicles many of the experimental programs, in materials science and biology, that acted both as a stimulus to better microscope design and also as a testing ground for many instrumental innovations.

Virtual pinhole confocal microscope

Energy Technology Data Exchange (ETDEWEB)

George, J.S.; Rector, D.M.; Ranken, D.M. [Los Alamos National Lab., NM (United States). Biophysics Group; Peterson, B. [SciLearn Inc. (United States); Kesteron, J. [VayTech Inc. (United States)

1999-06-01

Scanned confocal microscopes enhance imaging capabilities, providing improved contrast and image resolution in 3-D, but existing systems have significant technical shortcomings and are expensive. Researchers at Los Alamos National Laboratory have developed a novel approach--virtual pinhole confocal microscopy--that uses state of the art illumination, detection, and data processing technologies to produce an imager with a number of advantages: reduced cost, faster imaging, improved efficiency and sensitivity, improved reliability and much greater flexibility. Work at Los Alamos demonstrated proof of principle; prototype hardware and software have been used to demonstrate technical feasibility of several implementation strategies. The system uses high performance illumination, patterned in time and space. The authors have built functional confocal imagers using video display technologies (LCD or DLP) and novel scanner based on a micro-lens array. They have developed a prototype system for high performance data acquisition and processing, designed to support realtime confocal imaging. They have developed algorithms to reconstruct confocal images from a time series of spatially sub-sampled images; software development remains an area of active development. These advances allow the collection of high quality confocal images (in fluorescence, reflectance and transmission modes) with equipment that can inexpensively retrofit to existing microscopes. Planned future extensions to these technologies will significantly enhance capabilities for microscopic imaging in a variety of applications, including confocal endoscopy, and confocal spectral imaging.

Bimodal atomic force microscopy imaging of isolated antibodies in air and liquids

International Nuclear Information System (INIS)

MartInez, N F; Lozano, J R; Herruzo, E T; Garcia, F; Garcia, R; Richter, C; Sulzbach, T

2008-01-01

We have developed a dynamic atomic force microscopy (AFM) method based on the simultaneous excitation of the first two flexural modes of the cantilever. The instrument, called a bimodal atomic force microscope, allows us to resolve the structural components of antibodies in both monomer and pentameric forms. The instrument operates in both high and low quality factor environments, i.e., air and liquids. We show that under the same experimental conditions, bimodal AFM is more sensitive to compositional changes than amplitude modulation AFM. By using theoretical and numerical methods, we study the material contrast sensitivity as well as the forces applied on the sample during bimodal AFM operation

Digital force-feedback for protein unfolding experiments using atomic force microscopy

Science.gov (United States)

Bippes, Christian A.; Janovjak, Harald; Kedrov, Alexej; Muller, Daniel J.

2007-01-01

Since its invention in the 1990s single-molecule force spectroscopy has been increasingly applied to study protein (un-)folding, cell adhesion, and ligand-receptor interactions. In most force spectroscopy studies, the cantilever of an atomic force microscope (AFM) is separated from a surface at a constant velocity, thus applying an increasing force to folded bio-molecules or bio-molecular bonds. Recently, Fernandez and co-workers introduced the so-called force-clamp technique. Single proteins were subjected to a defined constant force allowing their life times and life time distributions to be directly measured. Up to now, the force-clamping was performed by analogue PID controllers, which require complex additional hardware and might make it difficult to combine the force-feedback with other modes such as constant velocity. These points may be limiting the applicability and versatility of this technique. Here we present a simple, fast, and all-digital (software-based) PID controller that yields response times of a few milliseconds in combination with a commercial AFM. We demonstrate the performance of our feedback loop by force-clamp unfolding of single Ig27 domains of titin and the membrane proteins bacteriorhodopsin (BR) and the sodium/proton antiporter NhaA.

Digital force-feedback for protein unfolding experiments using atomic force microscopy

International Nuclear Information System (INIS)

Bippes, Christian A; Janovjak, Harald; Kedrov, Alexej; Muller, Daniel J

2007-01-01

Since its invention in the 1990s single-molecule force spectroscopy has been increasingly applied to study protein (un-)folding, cell adhesion, and ligand-receptor interactions. In most force spectroscopy studies, the cantilever of an atomic force microscope (AFM) is separated from a surface at a constant velocity, thus applying an increasing force to folded bio-molecules or bio-molecular bonds. Recently, Fernandez and co-workers introduced the so-called force-clamp technique. Single proteins were subjected to a defined constant force allowing their life times and life time distributions to be directly measured. Up to now, the force-clamping was performed by analogue PID controllers, which require complex additional hardware and might make it difficult to combine the force-feedback with other modes such as constant velocity. These points may be limiting the applicability and versatility of this technique. Here we present a simple, fast, and all-digital (software-based) PID controller that yields response times of a few milliseconds in combination with a commercial AFM. We demonstrate the performance of our feedback loop by force-clamp unfolding of single Ig27 domains of titin and the membrane proteins bacteriorhodopsin (BR) and the sodium/proton antiporter NhaA

Difficulties in fitting the thermal response of atomic force microscope cantilevers for stiffness calibration

International Nuclear Information System (INIS)

Cole, D G

2008-01-01

This paper discusses the difficulties of calibrating atomic force microscope (AFM) cantilevers, in particular the effect calibrating under light fluid-loading (in air) and under heavy fluid-loading (in water) has on the ability to use thermal motion response to fit model parameters that are used to determine cantilever stiffness. For the light fluid-loading case, the resonant frequency and quality factor can easily be used to determine stiffness. The extension of this approach to the heavy fluid-loading case is troublesome due to the low quality factor (high damping) caused by fluid-loading. Simple calibration formulae are difficult to realize, and the best approach is often to curve-fit the thermal response, using the parameters of natural frequency and mass ratio so that the curve-fit's response is within some acceptable tolerance of the actual thermal response. The parameters can then be used to calculate the cantilever stiffness. However, the process of curve-fitting can lead to erroneous results unless suitable care is taken. A feedback model of the fluid–structure interaction between the unloaded cantilever and the hydrodynamic drag provides a framework for fitting a modeled thermal response to a measured response and for evaluating the parametric uncertainty of the fit. The cases of uncertainty in the natural frequency, the mass ratio, and combined uncertainty are presented and the implications for system identification and stiffness calibration using curve-fitting techniques are discussed. Finally, considerations and recommendations for the calibration of AFM cantilevers are given in light of the results of this paper

High-speed broadband nanomechanical property quantification and imaging of life science materials using atomic force microscope

Science.gov (United States)

Ren, Juan

Nanoscale morphological characterization and mechanical properties quantification of soft and biological materials play an important role in areas ranging from nano-composite material synthesis and characterization, cellular mechanics to drug design. Frontier studies in these areas demand the coordination between nanoscale morphological evolution and mechanical behavior variations through simultaneous measurement of these two aspects of properties. Atomic force microscope (AFM) is very promising in achieving such simultaneous measurements at high-speed and broadband owing to its unique capability in applying force stimuli and then, measuring the response at specific locations in a physiologically friendly environment with pico-newton force and nanometer spatial resolution. Challenges, however, arise as current AFM systems are unable to account for the complex and coupled dynamics of the measurement system and probe-sample interaction during high-speed imaging and broadband measurements. In this dissertation, the creation of a set of dynamics and control tools to probe-based high-speed imaging and rapid broadband nanomechanical spectroscopy of soft and biological materials are presented. Firstly, advanced control-based approaches are presented to improve the imaging performance of AFM imaging both in air and in liquid. An adaptive contact mode (ACM) imaging scheme is proposed to replace the traditional contact mode (CM) imaging by addressing the major concerns in both the speed and the force exerted to the sample. In this work, the image distortion caused by the topography tracking error is accounted for in the topography quantification and the quantified sample topography is utilized in a gradient-based optimization method to adjust the cantilever deflection set-point for each scanline closely around the minimal level needed for maintaining a stable probe-sample contact, and a data-driven iterative feedforward control that utilizes a prediction of the next

Development and application of a window-type environmental cell in high voltage electron microscope

International Nuclear Information System (INIS)

Wakasugi, Takenobu; Isobe, Shigehito; Umeda, Ayaka; Wang, Yongming; Hashimoto, Naoyuki; Ohnuki, Somei

2013-01-01

Highlights: ► A window-type environmental cell for a high voltage electron microscope (HVEM) is developed. ► In situ HVEM image of Pd under an H2 gas pressure is obtained. ► The effect of the window materials on the resolution and contamination of the HVEM image is tested. -- Abstract: A close type of an environmental cell was developed for a high voltage electron microscope. Using this cell allowed an in situ observation of hydrogenation in Pd particles under H 2 gas of 0.05 MPa at RT. Two types of window films, Tri-Acetyl-Cellulose (TAC) and Silicon Nitride (SiN), were used for testing the contamination on the sample, as well as the strength for pressure. We confirmed the hydrogenation in diffraction patterns and images, and additionally the image resolution of 0.19 nm was obtained by using a SiN film with a thickness of 17 nm

Effect of Excess Gravitational Force on Cultured Myotubes in Vitro

Directory of Open Access Journals (Sweden)

Shigehiro Hashimoto

2013-06-01

Full Text Available An effect of an excess gravitational force on cultured myoblasts has been studied in an experimental system with centrifugal force in vitro. Mouse myoblasts (C2C12 were seeded on a culture dish of 35 mm diameter, and cultured in the Dulbecco's Modified Eagle's Medium until the sub-confluent condition. To apply the excess gravitational force on the cultured cells, the dish was set in a conventional centrifugal machine. Constant gravitational force was applied to the cultured cells for three hours. Variations were made on the gravitational force (6 G, 10 G, 100 G, 500 G, and 800 G with control of the rotational speed of the rotator in the centrifugal machine. Morphology of the cells was observed with a phasecontrast microscope for eight days. The experimental results show that the myotube thickens day by day after the exposure to the excess gravitational force field. The results also show that the higher excess gravitational force thickens myotubes. The microscopic study shows that myotubes thicken with fusion each other.

Monitoring ligand-receptor interactions by photonic force microscopy

Energy Technology Data Exchange (ETDEWEB)

Jeney, Sylvia [M E Mueller Institute for Structural Biology, Biozentrum, University of Basel, Klingelbergstrasse 70, Basel, 4056 (Switzerland); Mor, Flavio; Forro, Laszlo [Laboratory of Complex Matter Physics (LPMC), Ecole Polytechnique Federale de Lausanne (EPFL), CH-1015 Lausanne (Switzerland); Koszali, Roland [Institute for Information and Communication Technologies (IICT), University of Applied Sciences of Western Switzerland (HEIG-VD), Rue Galilee 15, CH 1401 Yverdon-les-bains (Switzerland); Moy, Vincent T, E-mail: sylvia.jeney@unibas.ch, E-mail: vmoy@miami.edu [Department of Physiology and Biophysics, University of Miami Miller School of Medicine, 1600 NW 10th Avenue, Miami, FL 33136 (United States)

2010-06-25

We introduce a method for the acquisition of single molecule force measurements of ligand-receptor interactions using the photonic force microscope (PFM). Biotin-functionalized beads, manipulated with an optical trap, and a streptavidin-functionalized coverslip were used to measure the effect of different pulling forces on the lifetime of individual streptavidin-biotin complexes. By optimizing the design of the optical trap and selection of the appropriate bead size, pulling forces in excess of 50 pN were achieved. Based on the amplitude of three-dimensional (3D) thermal position fluctuations of the attached bead, we were able to select for a bead-coverslip interaction that was mediated by a single streptavidin-biotin complex. Moreover, the developed experimental system was greatly accelerated by automation of data acquisition and analysis. In force-dependent kinetic measurements carried out between streptavidin and biotin, we observed that the streptavidin-biotin complex exhibited properties of a catch bond, with the lifetime increasing tenfold when the pulling force increased from 10 to 20 pN. We also show that silica beads were more appropriate than polystyrene beads for the force measurements, as tethers, longer than 200 nm, could be extracted from polystyrene beads.

Monitoring ligand-receptor interactions by photonic force microscopy

International Nuclear Information System (INIS)

Jeney, Sylvia; Mor, Flavio; Forro, Laszlo; Koszali, Roland; Moy, Vincent T

2010-01-01

We introduce a method for the acquisition of single molecule force measurements of ligand-receptor interactions using the photonic force microscope (PFM). Biotin-functionalized beads, manipulated with an optical trap, and a streptavidin-functionalized coverslip were used to measure the effect of different pulling forces on the lifetime of individual streptavidin-biotin complexes. By optimizing the design of the optical trap and selection of the appropriate bead size, pulling forces in excess of 50 pN were achieved. Based on the amplitude of three-dimensional (3D) thermal position fluctuations of the attached bead, we were able to select for a bead-coverslip interaction that was mediated by a single streptavidin-biotin complex. Moreover, the developed experimental system was greatly accelerated by automation of data acquisition and analysis. In force-dependent kinetic measurements carried out between streptavidin and biotin, we observed that the streptavidin-biotin complex exhibited properties of a catch bond, with the lifetime increasing tenfold when the pulling force increased from 10 to 20 pN. We also show that silica beads were more appropriate than polystyrene beads for the force measurements, as tethers, longer than 200 nm, could be extracted from polystyrene beads.

Microscopic description of magnetized plasma: quasiparticle concept

International Nuclear Information System (INIS)

Sosenko, P.P.; Decyk, V.K.

1993-01-01

A quasiparticle concept is developed systematically, from first principles, within the context of microscopic description of magnetized plasma. It is argued that the zeroth velocity-gyroangle harmonic of the microscopic particle distribution function under the gyrokinetic change of variables can be taken as a microscopic quasi-particle density in a reduced phase space. The nature of quasiparticles is discussed and equations of their motion are derived within both exact and reduced microscopic descriptions. The reduced one employs explicitly the separation of interesting time scales. (orig.)

Modeling and boundary force control of microcantilevers utilized in atomic force microscopy for cellular imaging and characterization

Science.gov (United States)

Eslami, Sohrab

This dissertation undertakes the theoretical and experimental developments microcantilevers utilized in Atomic Force Microscopy (AFM) with applications to cellular imaging and characterization. The capability of revealing the inhomogeneties or interior of ultra-small materials has been of most interest to many researchers. However, the fundamental concept of signal and image formation remains unexplored and not fully understood. For his, a semi-empirical nonlinear force model is proposed to show that virtual frequency generation, regarded as the simplest synthesized subsurface probe, occurs optimally when the force is tuned to the van der Waals form. This is the first-time observation of a novel theoretical dynamic multi-frequency force microscopy that has not been already reported. Owing to the broad applications of microcantilevers in the nanoscale imaging and microscopic techniques, there is an essential feeling to study and propose a comprehensive model of such systems. Therefore, in the theoretical part of this dissertation, a distributed-parameters representation modeling of the microcantilever along with a general interaction force comprising of two attractive and repulsive components with general amplitude and power terms is studied. This model is investigated in a general 2D Cartesian coordinate to consider the motions of the probe with a tip mass. There is an excitation at the microcantilever's base such that the end of the beam is subject to the proposed general force. These forces are very sensitive to the amplitude and power terms of these parts; on the other hand, atomic intermolecular force is a function of the distance such that this distance itself is also a function of the interaction force that will result in a nonlinear implicit equation. From a parametric study in the probe-sample excitation, it is shown that the predicted behavior of the generated difference-frequency oscillation amplitude agrees well with experimental measurements. Following

Towards bridging the gap from molecular forces to the movement of organisms

DEFF Research Database (Denmark)

Nielsen, Bjørn Gilbert

2004-01-01

Muscles are responsible for generating the forces required for the movement of multicellular organisms. Microscopically, these forces arise as a consequence of motor proteins (myosin) pulling and sliding along actin filaments. Current knowledge states that the molecular forces between actin...

Theory of optical-tweezers forces near a plane interface

DEFF Research Database (Denmark)

Dutra, Rafael de Sousa; Neto, P. A. Maia; Nussenzveig, H. M.

2016-01-01

Optical-tweezers experiments in molecular and cell biology often take place near the surface of the microscope slide that defines the bottom of the sample chamber. There, as elsewhere, force measurements require forcecalibrated tweezers. In bulk, one can calculate the tweezers force from first pr...

Origins of phase contrast in the atomic force microscope in liquids

OpenAIRE

Melcher, John; Carrasco, Carolina; Xu, Xianfan; Carrascosa, Jose L; Gomez-Herrero, Julio; Jose de Pablo, Pedro; Raman, Arvind

2009-01-01

We study the physical origins of phase contrast in dynamic atomic force microscopy (dAFM) in liquids where low-stiffness microcantilever probes are often used for nanoscale imaging of soft biological samples with gentle forces. Under these conditions, we show that the phase contrast derives primarily from a unique energy flow channel that opens up in liquids due to the momentary excitation of higher eigenmodes. Contrary to the common assumption, phase-contrast images in liquids using soft mic...

In situ electrochemical atomic force microscope study on graphite electrodes

Energy Technology Data Exchange (ETDEWEB)

Hirasawa, K.A.; Sato, Tomohiro; Asahina, Hitoshi; Yamaguchi, Shoji; Mori, Shoichiro [Mitsubishi Chemical Corp., Inashiki, Ibaraki (Japan). Tsukuba Research Center

1997-04-01

Interest in the formation of the solid electrolyte interphase (SEI) film on graphite electrodes has increased recently in the quest to improve the performance of lithium-ion batteries. Topographic and frictional changes on the surface of a highly oriented pyrolytic graphite electrode in 1 M LiCiO{sub 4} ethylene carbonate/ethylmethyl carbonate (1:1) electrolyte were examined during charge and discharge by in situ electrochemical atomic force microscopy and friction force microscopy simultaneously in real-time. Solid electrolyte interphase film formation commenced at approximately 2 V vs. Li/Li{sup +} and stable film formation with an island-like morphology was observed below approximately 0.9 V vs. Li/Li{sup +}. Further experiments on a KS-44 graphite/polyvinylidene difluoride binder composite electrode showed similar phenomena.

Transmission positron microscopes

International Nuclear Information System (INIS)

Doyama, Masao; Kogure, Yoshiaki; Inoue, Miyoshi; Kurihara, Toshikazu; Yoshiie, Toshimasa; Oshima, Ryuichiro; Matsuya, Miyuki

2006-01-01

Immediate and near-future plans for transmission positron microscopes being built at KEK, Tsukuba, Japan, are described. The characteristic feature of this project is remolding a commercial electron microscope to a positron microscope. A point source of electrons kept at a negative high voltage is changed to a point source of positrons kept at a high positive voltage. Positional resolution of transmission microscopes should be theoretically the same as electron microscopes. Positron microscopes utilizing trapping of positrons have always positional ambiguity due to the diffusion of positrons

Analysis of mitochondrial mechanical dynamics using a confocal fluorescence microscope with a bent optical fibre.

Science.gov (United States)

Li, Yongbo; Honda, Satoshi; Iwami, Kentaro; Ohta, Yoshihiro; Umeda, Norihiro

2015-11-01

The cells in the cardiovascular system are constantly subjected to mechanical forces created by blood flow and the beating heart. The effect of forces on cells has been extensively investigated, but their effect on cellular organelles such as mitochondria remains unclear. We examined the impact of nano-Newton forces on mitochondria using a bent optical fibre (BOF) with a flat-ended tip (diameter exceeding 2 μm) and a confocal fluorescence microscope. By indenting a single mitochondrion with the BOF tip, we found that the mitochondrial elastic modulus was proportional to the (-1/2) power of the mitochondrial radius in the 9.6-115 kPa range. We stained the mitochondria with a potential-metric dye (TMRE) and measured the changes in TMRE fluorescence intensity. We confirmed that more active mitochondria exhibit a higher frequency of repetitive transient depolarization. The same trend was observed at forces lower than 50 nN. We further showed that the depolarization frequency of mitochondria decreases under an extremely large force (nearly 100 nN). We conclude that mitochondrial function is affected by physical environmental factors, such as external forces at the nano-Newton level. © 2015 The Authors Journal of Microscopy © 2015 Royal Microscopical Society.

The extended wedge method: atomic force microscope friction calibration for improved tolerance to instrument misalignments, tip offset, and blunt probes.

Science.gov (United States)

Khare, H S; Burris, D L

2013-05-01

One of the major challenges in understanding and controlling friction is the difficulty in bridging the length and time scales of macroscale contacts and those of the single asperity interactions they comprise. While the atomic force microscope (AFM) offers a unique ability to probe tribological surfaces in a wear-free single-asperity contact, instrument calibration challenges have limited the usefulness of this technique for quantitative nanotribological studies. A number of lateral force calibration techniques have been proposed and used, but none has gained universal acceptance due to practical considerations, configuration limitations, or sensitivities to unknowable error sources. This paper describes a simple extension of the classic wedge method of AFM lateral force calibration which: (1) allows simultaneous calibration and measurement on any substrate, thus eliminating prior tip damage and confounding effects of instrument setup adjustments; (2) is insensitive to adhesion, PSD cross-talk, transducer/piezo-tube axis misalignment, and shear-center offset; (3) is applicable to integrated tips and colloidal probes; and (4) is generally applicable to any reciprocating friction coefficient measurement. The method was applied to AFM measurements of polished carbon (99.999% graphite) and single crystal MoS2 to demonstrate the technique. Carbon and single crystal MoS2 had friction coefficients of μ = 0.20 ± 0.04 and μ = 0.006 ± 0.001, respectively, against an integrated Si probe. Against a glass colloidal sphere, MoS2 had a friction coefficient of μ = 0.005 ± 0.001. Generally, the measurement uncertainties ranged from 10%-20% and were driven by the effect of actual frictional variation on the calibration rather than calibration error itself (i.e., due to misalignment, tip-offset, or probe radius).

STATUS OF DEVELOPMENT OF DYNAMOMETER FORCE IN FEMALE ATHLETS

Directory of Open Access Journals (Sweden)

Dragan V. Doder

2009-11-01

Full Text Available The aim of this research was to perceive, on a great sample of sportswomen, di- vided according to the age, the current trend of the development of this ability related to some former researches that means to perceive concurrence or possibly distinguishing of those values related to the previous ones. On the sample of 792 sportswomen, at the age of 8 till 21, divided on sub-samples according to the age it was measured dynamometer force by classic methods of dynamometer measuring. Such obtained results placed in a data base of a Provincial Institution for sport in Novi Sad, were processed by methods of descriptive statistics, on the basis of which it was carried out a developing curve of this ability of a contemporary sports youth. Based on the size of some sub-samples it could be concluded that the number of some respondents within them at the age of 10 to 21 in most cases allow relevant concluding about developing trends of explosive force, altho- ugh it must be noticed that less presence of respondents in initial and final years allows only conditional conclusion. In sportswomen a developing curve is being characterized by a steady time of obtaining of maximum values (at the age of twenty till twenty-one and only at the muscles of legs maximum values are noted earlier at the age of eighteen till twenty. Dynamics of the development of dynamometer force till those maximum va- lues has a different trend for different muscular groups. After achieving of maximum values, force is being maintained constantly for a long time on a lower level, and only varies in rare cases. Within a female population a developing trend of dynamometer force is very prone to bigger varying of some muscular groups but because of that top values are being noted almost in the same period of a development of an individual. The time of lasting of those maximum values related to the male population is considerably shorter. Though, after the peak, sportswomen maintain the level

Immunogold labels: cell-surface markers in atomic force microscopy

NARCIS (Netherlands)

Putman, Constant A.J.; Putman, C.A.J.; de Grooth, B.G.; Hansma, Paul K.; van Hulst, N.F.; Greve, Jan

1993-01-01

The feasibility of using immunogold labels as cell-surface markers in atomic force microscopy is shown in this paper. The atomic force microscope (AFM) was used to image the surface of immunogold-labeled human lymphocytes. The lymphocytes were isolated from whole blood and labeled by an indirect

Scanning electron microscope

International Nuclear Information System (INIS)

Anon.

1980-01-01

The principle underlying the design of the scanning electron microscope (SEM), the design and functioning of SEM are described. Its applications in the areas of microcircuitry and materials science are outlined. The development of SEM in India is reviewed. (M.G.B.)

System analysis of force feedback microscopy

International Nuclear Information System (INIS)

Rodrigues, Mario S.; Costa, Luca; Chevrier, Joël; Comin, Fabio

2014-01-01

It was shown recently that the Force Feedback Microscope (FFM) can avoid the jump-to-contact in Atomic force Microscopy even when the cantilevers used are very soft, thus increasing force resolution. In this letter, we explore theoretical aspects of the associated real time control of the tip position. We take into account lever parameters such as the lever characteristics in its environment, spring constant, mass, dissipation coefficient, and the operating conditions such as controller gains and interaction force. We show how the controller parameters are determined so that the FFM functions at its best and estimate the bandwidth of the system under these conditions

System analysis of force feedback microscopy

Energy Technology Data Exchange (ETDEWEB)

Rodrigues, Mario S. [CFMC/Dep. de Física, Universidade de Lisboa, Campo Grande, 1749-016 Lisboa (Portugal); Costa, Luca [European Synchrotron Radiation Facility, 6 rue Jules Horowitz BP 220, 38043 Grenoble Cedex (France); Université Joseph Fourier BP 53, 38041 Grenoble Cedex 9 (France); Chevrier, Joël [European Synchrotron Radiation Facility, 6 rue Jules Horowitz BP 220, 38043 Grenoble Cedex (France); Université Grenoble Alpes, Inst NEEL, F-38042 Grenoble (France); CNRS, Inst NEEL, F-38042 Grenoble (France); Comin, Fabio [European Synchrotron Radiation Facility, 6 rue Jules Horowitz BP 220, 38043 Grenoble Cedex (France)

2014-02-07

It was shown recently that the Force Feedback Microscope (FFM) can avoid the jump-to-contact in Atomic force Microscopy even when the cantilevers used are very soft, thus increasing force resolution. In this letter, we explore theoretical aspects of the associated real time control of the tip position. We take into account lever parameters such as the lever characteristics in its environment, spring constant, mass, dissipation coefficient, and the operating conditions such as controller gains and interaction force. We show how the controller parameters are determined so that the FFM functions at its best and estimate the bandwidth of the system under these conditions.

Convergent Inquiry in Science & Engineering: The Use of Atomic Force Microscopy in a Biology Class

Science.gov (United States)

Lee, Il-Sun; Byeon, Jung-Ho; Kwon, Yong-Ju

2013-01-01

The purpose of this study was to design a teaching method suitable for science high school students using atomic force microscopy. During their scientific inquiry procedure, high school students observed a micro-nanostructure of a biological sample, which is unobservable via an optical microscope. The developed teaching method enhanced students'…

Nonequilibrium structure and dynamics in a microscopic model of thin-film active gels

NARCIS (Netherlands)

Head, D.A.; Briels, Willem J.; Gompper, G.

2014-01-01

In the presence of adenosine triphosphate, molecular motors generate active force dipoles that drive suspensions of protein filaments far from thermodynamic equilibrium, leading to exotic dynamics and pattern formation. Microscopic modeling can help to quantify the relationship between individual

Recent developments in dimensional nanometrology using AFMs

Science.gov (United States)

Yacoot, Andrew; Koenders, Ludger

2011-12-01

Scanning probe microscopes, in particular the atomic force microscope (AFM), have developed into sophisticated instruments that, throughout the world, are no longer used just for imaging, but for quantitative measurements. A role of the national measurement institutes has been to provide traceable metrology for these instruments. This paper presents a brief overview as to how this has been achieved, highlights the future requirements for metrology to support developments in AFM technology and describes work in progress to meet this need.

Recent developments in dimensional nanometrology using AFMs

International Nuclear Information System (INIS)

Yacoot, Andrew; Koenders, Ludger

2011-01-01

Scanning probe microscopes, in particular the atomic force microscope (AFM), have developed into sophisticated instruments that, throughout the world, are no longer used just for imaging, but for quantitative measurements. A role of the national measurement institutes has been to provide traceable metrology for these instruments. This paper presents a brief overview as to how this has been achieved, highlights the future requirements for metrology to support developments in AFM technology and describes work in progress to meet this need. (perspective)

X-ray microscope with a Wolter mirror

International Nuclear Information System (INIS)

Watanabe, Norio; Aoki, Sadao

2003-01-01

A Wolter mirror as an objective of an X-ray microscope is described. In comparison with other optical elements, a Wolter mirror has several advantages, such as a large numerical aperture and no chromatic aberration. Recent developments of fabrication process enabled us to make a Wolter mirror objective for X-rays. The fabrication process and the applications to a soft X-ray microscope and an X-ray fluorescence microscope are described. (author)

Microscopic cluster model analysis of 14O+p elastic scattering

International Nuclear Information System (INIS)

Baye, D.; Descouvemont, P.; Leo, F.

2005-01-01

The 14 O+p elastic scattering is discussed in detail in a fully microscopic cluster model. The 14 O cluster is described by a closed p shell for protons and a closed p3/2 subshell for neutrons in the translation-invariant harmonic-oscillator model. The exchange and spin-orbit parameters of the effective forces are tuned on the energy levels of the 15 C mirror system. With the generator-coordinate and microscopic R-matrix methods, phase shifts and cross sections are calculated for the 14 O+p elastic scattering. An excellent agreement is found with recent experimental data. A comparison is performed with phenomenological R-matrix fits. Resonances properties in 15 F are discussed

Use of results from microscopic methods in optical model calculations

International Nuclear Information System (INIS)

Lagrange, C.

1985-11-01

A concept of vectorization for coupled-channel programs based upon conventional methods is first presented. This has been implanted in our program for its use on the CRAY-1 computer. In a second part we investigate the capabilities of a semi-microscopic optical model involving fewer adjustable parameters than phenomenological ones. The two main ingredients of our calculations are, for spherical or well-deformed nuclei, the microscopic optical-model calculations of Jeukenne, Lejeune and Mahaux and nuclear densities from Hartree-Fock-Bogoliubov calculations using the density-dependent force D1. For transitional nuclei deformation-dependent nuclear structure wave functions are employed to weigh the scattering potentials for different shapes and channels [fr

Aspects of scanning force microscope probes and their effects on dimensional measurement

Energy Technology Data Exchange (ETDEWEB)

Yacoot, Andrew [National Physical Laboratory, Teddington, Middlesex TW11 0LW (United Kingdom); Koenders, Ludger [Physikalisch-Technische Bundesanstalt, Bundesallee 100, 38116 Braunschweig (Germany)], E-mail: andrew.yacoot@npl.co.uk

2008-05-21

The review will describe the various scanning probe microscopy tips and cantilevers used today for scanning force microscopy and magnetic force microscopy. Work undertaken to quantify the properties of cantilevers and tips, e.g. shape and radius, is reviewed together with an overview of the various tip-sample interactions that affect dimensional measurements. (topical review)

Aspects of scanning force microscope probes and their effects on dimensional measurement

International Nuclear Information System (INIS)

Yacoot, Andrew; Koenders, Ludger

2008-01-01

The review will describe the various scanning probe microscopy tips and cantilevers used today for scanning force microscopy and magnetic force microscopy. Work undertaken to quantify the properties of cantilevers and tips, e.g. shape and radius, is reviewed together with an overview of the various tip-sample interactions that affect dimensional measurements. (topical review)

A versatile LabVIEW and field-programmable gate array-based scanning probe microscope for in operando electronic device characterization.

Science.gov (United States)

Berger, Andrew J; Page, Michael R; Jacob, Jan; Young, Justin R; Lewis, Jim; Wenzel, Lothar; Bhallamudi, Vidya P; Johnston-Halperin, Ezekiel; Pelekhov, Denis V; Hammel, P Chris

2014-12-01

Understanding the complex properties of electronic and spintronic devices at the micro- and nano-scale is a topic of intense current interest as it becomes increasingly important for scientific progress and technological applications. In operando characterization of such devices by scanning probe techniques is particularly well-suited for the microscopic study of these properties. We have developed a scanning probe microscope (SPM) which is capable of both standard force imaging (atomic, magnetic, electrostatic) and simultaneous electrical transport measurements. We utilize flexible and inexpensive FPGA (field-programmable gate array) hardware and a custom software framework developed in National Instrument's LabVIEW environment to perform the various aspects of microscope operation and device measurement. The FPGA-based approach enables sensitive, real-time cantilever frequency-shift detection. Using this system, we demonstrate electrostatic force microscopy of an electrically biased graphene field-effect transistor device. The combination of SPM and electrical transport also enables imaging of the transport response to a localized perturbation provided by the scanned cantilever tip. Facilitated by the broad presence of LabVIEW in the experimental sciences and the openness of our software solution, our system permits a wide variety of combined scanning and transport measurements by providing standardized interfaces and flexible access to all aspects of a measurement (input and output signals, and processed data). Our system also enables precise control of timing (synchronization of scanning and transport operations) and implementation of sophisticated feedback protocols, and thus should be broadly interesting and useful to practitioners in the field.

Microscopic and macroscopic characterization of the charging effects in SiC/Si nanocrystals/SiC sandwiched structures

International Nuclear Information System (INIS)

Xu, Jie; Xu, Jun; Wang, Yuefei; Cao, Yunqing; Li, Wei; Yu, Linwei; Chen, Kunji

2014-01-01

Microscopic charge injection into the SiC/Si nanocrystals/SiC sandwiched structures through a biased conductive AFM tip is subsequently characterized by both electrostatic force microscopy and Kelvin probe force microscopy (KPFM). The charge injection and retention characteristics are found to be affected by not only the band offset at the Si nanocrystals/SiC interface but also the doping type of the Si substrate. On the other hand, capacitance–voltage (C–V) measurements investigate the macroscopic charging effect of the sandwiched structures with a thicker SiC capping layer, where the charges are injected from the Si substrates. The calculated macroscopic charging density is 3–4 times that of the microscopic one, and the possible reason is the underestimation of the microscopic charging density caused by the averaging effect and detection delay in the KPFM measurements. (paper)

The Digital Microscope and Its Image Processing Utility

Directory of Open Access Journals (Sweden)

Tri Wahyu Supardi

2011-12-01

Full Text Available Many institutions, including high schools, own a large number of analog or ordinary microscopes. These microscopes are used to observe small objects. Unfortunately, object observations on the ordinary microscope require precision and visual acuity of the user. This paper discusses the development of a high-resolution digital microscope from an analog microscope, including the image processing utility, which allows the digital microscope users to capture, store and process the digital images of the object being observed. The proposed microscope is constructed from hardware components that can be easily found in Indonesia. The image processing software is capable of performing brightness adjustment, contrast enhancement, histogram equalization, scaling and cropping. The proposed digital microscope has a maximum magnification of 1600x, and image resolution can be varied from 320x240 pixels up to 2592x1944 pixels. The microscope was tested with various objects with a variety of magnification, and image processing was carried out on the image of the object. The results showed that the digital microscope and its image processing system were capable of enhancing the observed object and other operations in accordance with the user need. The digital microscope has eliminated the need for direct observation by human eye as with the traditional microscope.

Microscopic calculation of the 4He system

International Nuclear Information System (INIS)

Hofmann, H.M.

1996-01-01

We report on a consistent, microscopic calculation of the bound and scattering states in the 4 He system employing a realistic nucleon-nucleon potential in the framework of the resonating group model (RGM). We present for comparison with these microscopic RGM calculations the results from a charge-independent, Coulomb-corrected R-matrix analysis of all types of data for reactions in the A=4 system. Comparisons are made between the phase shifts, and with a selection of measurements from each reaction, as well as between the resonance spectra obtained from both calculations. In general, the comparisons are favorable, but distinct differences are observed between the RGM calculations and some of the polarisation data. The partial-wave decomposition of the experimental data produced by the R-matrix analysis shows that these differences can be attributed to just a few S-matrix elements, for which inadequate tensor-force strength in the N-N interaction used appears to be responsible. (orig.)

Designs for a quantum electron microscope.

Science.gov (United States)

Kruit, P; Hobbs, R G; Kim, C-S; Yang, Y; Manfrinato, V R; Hammer, J; Thomas, S; Weber, P; Klopfer, B; Kohstall, C; Juffmann, T; Kasevich, M A; Hommelhoff, P; Berggren, K K

2016-05-01

One of the astounding consequences of quantum mechanics is that it allows the detection of a target using an incident probe, with only a low probability of interaction of the probe and the target. This 'quantum weirdness' could be applied in the field of electron microscopy to generate images of beam-sensitive specimens with substantially reduced damage to the specimen. A reduction of beam-induced damage to specimens is especially of great importance if it can enable imaging of biological specimens with atomic resolution. Following a recent suggestion that interaction-free measurements are possible with electrons, we now analyze the difficulties of actually building an atomic resolution interaction-free electron microscope, or "quantum electron microscope". A quantum electron microscope would require a number of unique components not found in conventional transmission electron microscopes. These components include a coherent electron beam-splitter or two-state-coupler, and a resonator structure to allow each electron to interrogate the specimen multiple times, thus supporting high success probabilities for interaction-free detection of the specimen. Different system designs are presented here, which are based on four different choices of two-state-couplers: a thin crystal, a grating mirror, a standing light wave and an electro-dynamical pseudopotential. Challenges for the detailed electron optical design are identified as future directions for development. While it is concluded that it should be possible to build an atomic resolution quantum electron microscope, we have also identified a number of hurdles to the development of such a microscope and further theoretical investigations that will be required to enable a complete interpretation of the images produced by such a microscope. Copyright © 2016 The Authors. Published by Elsevier B.V. All rights reserved.

Microscopic Investigation of Materials Limitations of Superconducting RF Cavities

Energy Technology Data Exchange (ETDEWEB)

Anlage, Steven [Univ. of Maryland, College Park, MD (United States)

2017-08-04

Our overall goal is to contribute to the understanding of defects that limit the high accelerating gradient performance of Nb SRF cavities. Our approach is to develop a microscopic connection between materials defects and SRF performance. We developed a near-field microwave microscope to establish this connection. The microscope is based on magnetic hard drive write heads, which are designed to create very strong rf magnetic fields in very small volumes on a surface.

Levitation force on a permanent magnet over a superconducting plane: Modified critical-state model

International Nuclear Information System (INIS)

Yang, Z.J.

1997-01-01

The authors consider a model system of a permanent magnet above a semi-infinite superconductor. They introduce a modified critical-state model, and carry out derivations of the levitation force acting on the magnet. A key feature of the modification allows the current density to be less than the critical value. The theoretical results show an exponential relationship between the force and the distance. Analytical expressions are developed for permanent magnets in the form of a point dipole, a tip of a magnetic force microscope, and a cylindrical magnet. In the latter case, the exponential relationship has been observed in numerous experiments but without previous interpretation

Mechanical design and force calibration of dual-axis micromechanical probe for friction force microscopy

International Nuclear Information System (INIS)

Fukuzawa, Kenji; Terada, Satoshi; Shikida, Mitsuhiro; Amakawa, Hiroaki; Zhang, Hedong; Mitsuya, Yasunaga

2007-01-01

A dual-axis micromechanical probe that combines a double cantilever and torsion beams is presented. This probe can reduce the mechanical cross-talk between the lateral and vertical force detections. In addition, dual-axis forces can be detected by measuring the dual-axis displacement of the probe end using the optical lever-based method used in conventional friction force microscopes (FFMs). In this paper, the mechanical design of the probe, the details of the fabrication method, FFM performance, and calibration of the friction force are discussed. The mechanical design and the microfabrication method for probes that can provide a force resolution of the order of 1 nN without mechanical cross-talk are presented. Calibration of the lateral force signal is possible by using the relationship between the lateral force and the piezodisplacement at the onset of the probe scanning. The micromechanical probe enables simultaneous and independent detection of atomic and friction forces. This leads to accurate investigation of nanotribological phenomena and visualization of the distribution of the friction properties, which helps the identification of the material properties

On the way to a microscopic derivation of covariant density functionals in nuclei

Science.gov (United States)

Ring, Peter

2018-02-01

Several methods are discussed to derive covariant density functionals from the microscopic input of bare nuclear forces. In a first step there are semi-microscopic functionals, which are fitted to ab-initio calculations of nuclear matter and depend in addition on very few phenomenological parameters. They are able to describe nuclear properties with the same precision as fully phenomenological functionals. In a second step we present first relativistic Brueckner-Hartree-Fock calculations in finite nuclei in order to study properties of such functionals, which cannot be obtained from nuclear matter calculations.

A new computerized moving stage for optical microscopes

Science.gov (United States)

Hatiboglu, Can Ulas; Akin, Serhat

2004-06-01

Measurements of microscope stage movements in the x and y directions are of importance for some stereological methods. Traditionally, the length of stage movements is measured with differing precision and accuracy using a suitable motorized stage, a microscope and software. Such equipment is generally expensive and not readily available in many laboratories. One other challenging problem is the adaptability to available microscope systems which weakens the possibility of the equipment to be used with any kind of light microscope. This paper describes a simple and cheap programmable moving stage that can be used with the available microscopes in the market. The movements of the stage are controlled by two servo-motors and a controller chip via a Java-based image processing software. With the developed motorized stage and a microscope equipped with a CCD camera, the software allows complete coverage of the specimens with minimum overlap, eliminating the optical strain associated with counting hundreds of images through an eyepiece, in a quick and precise fashion. The uses and the accuracy of the developed stage are demonstrated using thin sections obtained from a limestone core plug.

Development of HiLo Microscope and its use in In-Vivo Applications

Science.gov (United States)

Patel, Shreyas J.

The functionality of achieving optical sectioning in biomedical research is invaluable as it allows for visualization of a biological sample at different depths while being free of background scattering. Most current microscopy techniques that offer optical sectioning, unfortunately, require complex instrumentation and thus are generally costly. HiLo microscopy, on the other hand, offers the same functionality and advantage at a relatively low cost. Hence, the work described in this thesis involves the design, build, and application of a HiLo microscope. More specifically, a standalone HiLo microscope was built in addition to implementing HiLo microscopy on a standard fluorescence microscope. In HiLo microscopy, optical sectioning is achieved by acquiring two different types of images per focal plane. One image is acquired under uniform illumination and the other is acquired under speckle illumination. These images are processed using an algorithm that extracts in-focus information and removes features and glare that occur as a result of background fluorescence. To show the benefits of the HiLo microscopy, several imaging experiments on various samples were performed under a HiLo microscope and compared against a traditional fluorescence microscope and a confocal microscope, which is considered the gold standard in optical imaging. In-vitro and ex-vivo imaging was performed on a set of pollen grains, and optically cleared mouse brain and heart slices. Each of these experiments showed great reduction in background scattering at different depths under HiLo microscopy. More importantly, HiLo imaging of optically cleared heart slice demonstrated emergence of different vasculature at different depths. Reduction of out-of-focus light increased the spatial resolution and allowed better visualization of capillary vessels. Furthermore, HiLo imaging was tested in an in-vivo model of a rodent dorsal window chamber model. When imaging the same sample under confocal microscope

On the resolution of the electron microscopic radioautography

International Nuclear Information System (INIS)

Uchida, Kazuko; Daimon, Tateo; Kawai, Kazuhiro

1981-01-01

The aim of electron microscopic radioautography is to reveal the exact localization of certain substances at the macromolecular level. In order to attain this object the establishment of a fine grain development method is indispensable. Some of latent images are formed at the contact surface between the polyhedral halide silver grain and the section surface, where the impact of #betta# particles come directly from the section involved, and since it is in contact with the section it remains in place even after development and gelatin removal. This latent image finally becomes a developed silver grain in the electron microscope radioautogram. Although the limit of resolution in electron microscopic radioautography is supposed to be the diameter of halide silver grains in emulsion, it may be improved by considering the fact that the contact area between the halide silver grain and the section surface is the minimum unit of resolution. The minimum resolution of electron microscopic radioautography was determined histologically to be about 100A. (author)

Measurement and analysis of thrust force in drilling sisal-glass fiber reinforced polymer composites

Science.gov (United States)

Ramesh, M.; Gopinath, A.

2017-05-01

Drilling of composite materials is difficult when compared to the conventional materials because of its in-homogeneous nature. The force developed during drilling play a major role in the surface quality of the hole and minimizing the damages around the surface. This paper focuses the effect of drilling parameters on thrust force in drilling of sisal-glass fiber reinforced polymer composite laminates. The quadratic response models are developed by using response surface methodology (RSM) to predict the influence of cutting parameters on thrust force. The adequacy of the models is checked by using the analysis of variance (ANOVA). A scanning electron microscope (SEM) analysis is carried out to analyze the quality of the drilled surface. From the results, it is found that, the feed rate is the most influencing parameter followed by spindle speed and the drill diameter is the least influencing parameter on the thrust force.

Design and Development of a compact and ruggest phase and flouresence microscope for space utilization, Phase I

Data.gov (United States)

National Aeronautics and Space Administration — In this SBIR Phase 1 we propose to develop a novel microscope by integrating Fourier phase contrast microscopy (FPCM) and epi-fluorescence microscopy. In FPCM, the...

Air Force Civilian Senior Leadership Development Challenges

National Research Council Canada - National Science Library

Webb, Billy P

2008-01-01

.... While Gen Jumper's sight picture recognizes the need to grow civilians for leadership positions, there is a more compelling reason for the Air Force to focus on civilian leadership development...

Anti-drift and auto-alignment mechanism for an astigmatic atomic force microscope system based on a digital versatile disk optical head.

Science.gov (United States)

Hwu, E-T; Illers, H; Wang, W-M; Hwang, I-S; Jusko, L; Danzebrink, H-U

2012-01-01

In this work, an anti-drift and auto-alignment mechanism is applied to an astigmatic detection system (ADS)-based atomic force microscope (AFM) for drift compensation and cantilever alignment. The optical path of the ADS adopts a commercial digital versatile disc (DVD) optical head using the astigmatic focus error signal. The ADS-based astigmatic AFM is lightweight, compact size, low priced, and easy to use. Furthermore, the optical head is capable of measuring sub-atomic displacements of high-frequency AFM probes with a sub-micron laser spot (~570 nm, FWHM) and a high-working bandwidth (80 MHz). Nevertheless, conventional DVD optical heads suffer from signal drift problems. In a previous setup, signal drifts of even thousands of nanometers had been measured. With the anti-drift and auto-alignment mechanism, the signal drift is compensated by actuating a voice coil motor of the DVD optical head. A nearly zero signal drift was achieved. Additional benefits of this mechanism are automatic cantilever alignment and simplified design.

Development of full-field x-ray phase-tomographic microscope based on laboratory x-ray source

Science.gov (United States)

Takano, H.; Wu, Y.; Momose, A.

2017-09-01

An X-ray phase tomographic microscope that can quantitatively measure the refractive index of a sample in three dimensions with a high spatial resolution was developed by installing a Lau interferometer consisting of an absorption grating and a π/2 phase grating into the optics of an X-ray microscope. The optics comprises a Cu rotating anode X-ray source, capillary condenser optics, and a Fresnel zone plate for the objective. The microscope has two optical modes: a large-field-of-view mode (field of view: 65 μm x 65 μm) and a high-resolution mode (spatial resolution: 50 nm). Optimizing the parameters of the interferometer yields a self-image of the phase grating with 60% visibility. Through the normal fringe-scanning measurement, a twin phase image, which has an overlap of two phase image of opposite contrast with a shear distance much larger than system resolution, is generated. Although artifacts remain to some extent currently when a phase image is calculated from the twin phase image, this system can obtain high-spatial-resolution images resolving 50-nm structures. Phase tomography with this system has also been demonstrated using a phase object.

Continuum-kinetic-microscopic model of lung clearance due to core-annular fluid entrainment

International Nuclear Information System (INIS)

Mitran, Sorin

2013-01-01

The human lung is protected against aspirated infectious and toxic agents by a thin liquid layer lining the interior of the airways. This airway surface liquid is a bilayer composed of a viscoelastic mucus layer supported by a fluid film known as the periciliary liquid. The viscoelastic behavior of the mucus layer is principally due to long-chain polymers known as mucins. The airway surface liquid is cleared from the lung by ciliary transport, surface tension gradients, and airflow shear forces. This work presents a multiscale model of the effect of airflow shear forces, as exerted by tidal breathing and cough, upon clearance. The composition of the mucus layer is complex and variable in time. To avoid the restrictions imposed by adopting a viscoelastic flow model of limited validity, a multiscale computational model is introduced in which the continuum-level properties of the airway surface liquid are determined by microscopic simulation of long-chain polymers. A bridge between microscopic and continuum levels is constructed through a kinetic-level probability density function describing polymer chain configurations. The overall multiscale framework is especially suited to biological problems due to the flexibility afforded in specifying microscopic constituents, and examining the effects of various constituents upon overall mucus transport at the continuum scale

Gas dynamic virtual nozzle for generation of microscopic droplet streams

Energy Technology Data Exchange (ETDEWEB)

DePonte, D P; Weierstall, U; Schmidt, K; Warner, J; Starodub, D; Spence, J C H; Doak, R B [Department of Physics, Arizona State University, Tempe, AZ 85287-1504 (United States)], E-mail: dandeponte@gmail.com

2008-10-07

As shown by Ganan-Calvo (1998 Phys. Rev. Lett. 80 285-8), a free liquid jet can be compressed in diameter through gas dynamic forces exerted by a coaxially co-flowing gas, obviating the need for a solid nozzle to form a microscopic liquid jet and thereby alleviating the clogging problems that plague conventional droplet sources of small diameter. We describe in this paper a novel form of droplet beam source based on this principle. The source is miniature, robust, dependable, easily fabricated, essentially immune to clogging and eminently suitable for delivery of microscopic liquid droplets, including hydrated biological samples, into vacuum for analysis using vacuum instrumentation. Monodisperse, single-file droplet streams are generated by triggering the device with a piezoelectric actuator.

Distributed microscopic actuation analysis of paraboloidal membrane shells of different geometric parameters

Science.gov (United States)

Yue, Honghao; Lu, Yifan; Deng, Zongquan; Tzou, Hornsen

2018-03-01

Paraboloidal membrane shells of revolution are commonly used as key components for advanced aerospace structures and aviation mechanical systems. Due to their high flexibility and low damping property, active vibration control is of significant importance for these in-orbit membrane structures. To explore the dynamic control behavior of space flexible paraboloidal membrane shells, precision distributed actuation and control effectiveness of free-floating paraboloidal membrane shells with piezoelectric actuators are investigated. Governing equations of the shell structronic system are presented first. Then, distributed control forces and control actions are formulated. A transverse mode shape function of the paraboloidal shell based on the membrane approximation theory and specified boundary condition is assumed in the modal control force analysis. The actuator induced modal control forces on the paraboloidal shell are derived. The expressions of microscopic local modal control forces are obtained by shrinking the actuator area into infinitesimal and the four control components are investigated respectively to predict the spatial microscopic actuation behavior. Geometric parameter (height-radius ratio and shell thickness) effects on the modal actuation behavior are explored when evaluating the micro-control efficiency. Four different cases are discussed and the results reveal the fact that shallow (e.g., antennas/reflectors) and deep (e.g., rocket/missile fairing) paraboloidal shells exhibit totally different modal actuation behaviors due to their curvature differences. Analytical results in this paper can serve as guidelines for optimal actuator placement for vibration control of different paraboloidal structures.

Topotactic changes on η-Mo{sub 4}O{sub 11} caused by biased atomic force microscope tip and cw-laser

Energy Technology Data Exchange (ETDEWEB)

Borovšak, Miloš, E-mail: milos.borovsak@ijs.si [Jožef Stefan Institute, Jamova cesta 39, 1000 Ljubljana (Slovenia); Faculty for Mathematics and Physics, Jadranska ulica 19, 1000 Ljubljana (Slovenia); Šutar, Petra; Goreshnik, Evgeny [Jožef Stefan Institute, Jamova cesta 39, 1000 Ljubljana (Slovenia); Mihailovic, Dragan [Jožef Stefan Institute, Jamova cesta 39, 1000 Ljubljana (Slovenia); International Postgraduate School Jožef Stefan, Jamova cesta 39, 1000 Ljubljana (Slovenia)

2015-11-01

Highlights: • We report influencing electronic properties of η-Mo{sub 4}O{sub 11}. • With the biased AFM tip we induce the surface potential changes on η-Mo{sub 4}O{sub 11}. • We used cw-laser to induced similar effect on surface potential on η-Mo{sub 4}O{sub 11}. • We do not influence the surface and topography of the samples. • No change in topography of samples indicates the topotactic transformation. - Abstract: We present topotactic changes on Mo{sub 4}O{sub 11} crystals induced by a biased atomic force microscope tip and continuous laser. The transformation does not change the topography of the samples, while the surface potential shows remarkable changes on areas where the biased AFM tip was applied. No structural changes were observed by Raman spectroscopy, but AFM scans revealed changes to surface potential due to laser illumination. The observed phenomenon could be potentially useful for memristive memory devices considering the fact that properties of other molybdenum oxides vary from metallic to insulators.

Note: A scanning electron microscope sample holder for bidirectional characterization of atomic force microscope probe tips

Energy Technology Data Exchange (ETDEWEB)

Eisenstein, Alon; Goh, M. Cynthia [Department of Chemistry and Institute for Optical Sciences, University of Toronto, 80 St. George Street, Toronto M5S 3H6 (Canada)

2012-03-15

A novel sample holder that enables atomic force microscopy (AFM) tips to be mounted inside a scanning electron microscopy (SEM) for the purpose of characterizing the AFM tips is described. The holder provides quick and easy handling of tips by using a spring clip to hold them in place. The holder can accommodate two tips simultaneously in two perpendicular orientations, allowing both top and side view imaging of the tips by the SEM.

Development of a 6 DOF force-reflecting master input device

International Nuclear Information System (INIS)

Yoon, Ji Sup; Yoon, Ho Sik

1999-05-01

The teleoperator is a very effective tool for various tasks of nuclear application in that it can reduce the operators' exposure to the radiation. For the utmost performances of the teleoperator, the force reflection capability is essential. This capability represents a function of transmitting the contact force of teleoperator with the object to the human operator. With this function the human operator in the remote area can effectively guide the motion of the teleoperator so that it can follow a safety guaranteed path. In this research a fully force reflectible input device 96 axis) is developed. To develop the force reflecting device, the state of art is surveyed. Based on this survey, the 6 DOF manipulator which controls a power manipulator is fabricated and its performance is investigated. Also, various force reflection algorithms analyzed and the enhanced algorithm is proposed. (author). 18 refs., 4 tabs., 26 figs

Development of a 6 DOF force-reflecting master input device

Energy Technology Data Exchange (ETDEWEB)

Yoon, Ji Sup; Yoon, Ho Sik

1999-05-01

The teleoperator is a very effective tool for various tasks of nuclear application in that it can reduce the operators' exposure to the radiation. For the utmost performances of the teleoperator, the force reflection capability is essential. This capability represents a function of transmitting the contact force of teleoperator with the object to the human operator. With this function the human operator in the remote area can effectively guide the motion of the teleoperator so that it can follow a safety guaranteed path. In this research a fully force reflectible input device 96 axis is developed. To develop the force reflecting device, the state of art is surveyed. Based on this survey, the 6 DOF manipulator which controls a power manipulator is fabricated and its performance is investigated. Also, various force reflection algorithms analyzed and the enhanced algorithm is proposed. (author). 18 refs., 4 tabs., 26 fi0008.

Development of a 6 DOF force-reflecting master input device

Energy Technology Data Exchange (ETDEWEB)

Yoon, Ji Sup; Yoon, Ho Sik

1999-05-01

The teleoperator is a very effective tool for various tasks of nuclear application in that it can reduce the operators' exposure to the radiation. For the utmost performances of the teleoperator, the force reflection capability is essential. This capability represents a function of transmitting the contact force of teleoperator with the object to the human operator. With this function the human operator in the remote area can effectively guide the motion of the teleoperator so that it can follow a safety guaranteed path. In this research a fully force reflectible input device 96 axis is developed. To develop the force reflecting device, the state of art is surveyed. Based on this survey, the 6 DOF manipulator which controls a power manipulator is fabricated and its performance is investigated. Also, various force reflection algorithms analyzed and the enhanced algorithm is proposed. (author). 18 refs., 4 tabs., 26 fi0008.

On microscopic theory of radiative nuclear reaction characteristics

Energy Technology Data Exchange (ETDEWEB)

Kamerdzhiev, S. P. [National Research Centre “Kurchatov Institute” (Russian Federation); Achakovskiy, O. I., E-mail: oachakovskiy@ippe.ru; Avdeenkov, A. V. [Institute for Physics and Power Engineering (Russian Federation); Goriely, S. [Institut d’Astronomie et d’Astrophysique (Belgium)

2016-07-15

A survey of some results in the modern microscopic theory of properties of nuclear reactions with gamma rays is given. First of all, we discuss the impact of Phonon Coupling (PC) on the Photon Strength Function (PSF) because it represents the most natural physical source of additional strength found for Sn isotopes in recent experiments that could not be explained within the standard HFB + QRPA approach. The self-consistent version of the Extended Theory of Finite Fermi Systems in the Quasiparticle Time Blocking Approximation is applied. It uses the HFB mean field and includes both the QRPA and PC effects on the basis of the SLy4 Skyrme force. With our microscopic E1 PSFs, the following properties have been calculated for many stable and unstable even–even semi-magic Sn and Ni isotopes as well as for double-magic {sup 132}Sn and {sup 208}Pb using the reaction codes EMPIRE and TALYS with several Nuclear Level Density (NLD) models: (1) the neutron capture cross sections; (2) the corresponding neutron capture gamma spectra; (3) the average radiative widths of neutron resonances. In all the properties considered, the PC contribution turned out to be significant, as compared with the standard QRPA one, and necessary to explain the available experimental data. The results with the phenomenological so-called generalized superfluid NLD model turned out to be worse, on the whole, than those obtained with the microscopic HFB + combinatorial NLD model. The very topical question about the M1 resonance contribution to PSFs is also discussed.Finally, we also discuss the modern microscopic NLD models based on the self-consistent HFB method and show their relevance to explain the experimental data as compared with the phenomenological models. The use of these self-consistent microscopic approaches is of particular relevance for nuclear astrophysics, but also for the study of double-magic nuclei.

Non-contact quantification of laser micro-impulse in water by atomic force microscopy and its application for biomechanics

Science.gov (United States)

Hosokawa, Yoichiroh

2011-12-01

We developed a local force measurement system of a femtosecond laser-induced impulsive force, which is due to shock and stress waves generated by focusing an intense femtosecond laser into water with a highly numerical aperture objective lens. In this system, the force localized in micron-sized region was detected by bending movement of a cantilever of atomic force microscope (AFM). Here we calculated the bending movement of the AFM cantilever when the femtosecond laser is focused in water at the vicinity of the cantilever and the impulsive force is loaded on the cantilever. From the result, a method to estimate the total of the impulsive force at the laser focal point was suggested and applied to estimate intercellular adhesion strength.

Origins of phase contrast in the atomic force microscope in liquids.

Science.gov (United States)

Melcher, John; Carrasco, Carolina; Xu, Xin; Carrascosa, José L; Gómez-Herrero, Julio; José de Pablo, Pedro; Raman, Arvind

2009-08-18

We study the physical origins of phase contrast in dynamic atomic force microscopy (dAFM) in liquids where low-stiffness microcantilever probes are often used for nanoscale imaging of soft biological samples with gentle forces. Under these conditions, we show that the phase contrast derives primarily from a unique energy flow channel that opens up in liquids due to the momentary excitation of higher eigenmodes. Contrary to the common assumption, phase-contrast images in liquids using soft microcantilevers are often maps of short-range conservative interactions, such as local elastic response, rather than tip-sample dissipation. The theory is used to demonstrate variations in local elasticity of purple membrane and bacteriophage 29 virions in buffer solutions using the phase-contrast images.

Adaptive optical microscope for brain imaging in vivo

Science.gov (United States)

Wang, Kai

2017-04-01

The optical heterogeneity of biological tissue imposes a major limitation to acquire detailed structural and functional information deep in the biological specimens using conventional microscopes. To restore optimal imaging performance, we developed an adaptive optical microscope based on direct wavefront sensing technique. This microscope can reliably measure and correct biological samples induced aberration. We demonstrated its performance and application in structural and functional brain imaging in various animal models, including fruit fly, zebrafish and mouse.

A pragmatic guide to multiphoton microscope design

Science.gov (United States)

Young, Michael D.; Field, Jeffrey J.; Sheetz, Kraig E.; Bartels, Randy A.; Squier, Jeff

2016-01-01

Multiphoton microscopy has emerged as a ubiquitous tool for studying microscopic structure and function across a broad range of disciplines. As such, the intent of this paper is to present a comprehensive resource for the construction and performance evaluation of a multiphoton microscope that will be understandable to the broad range of scientific fields that presently exploit, or wish to begin exploiting, this powerful technology. With this in mind, we have developed a guide to aid in the design of a multiphoton microscope. We discuss source selection, optical management of dispersion, image-relay systems with scan optics, objective-lens selection, single-element light-collection theory, photon-counting detection, image rendering, and finally, an illustrated guide for building an example microscope. PMID:27182429

Optimizing 1-μs-Resolution Single-Molecule Force Spectroscopy on a Commercial Atomic Force Microscope.

Science.gov (United States)

Edwards, Devin T; Faulk, Jaevyn K; Sanders, Aric W; Bull, Matthew S; Walder, Robert; LeBlanc, Marc-Andre; Sousa, Marcelo C; Perkins, Thomas T

2015-10-14

Atomic force microscopy (AFM)-based single-molecule force spectroscopy (SMFS) is widely used to mechanically measure the folding and unfolding of proteins. However, the temporal resolution of a standard commercial cantilever is 50-1000 μs, masking rapid transitions and short-lived intermediates. Recently, SMFS with 0.7-μs temporal resolution was achieved using an ultrashort (L = 9 μm) cantilever on a custom-built, high-speed AFM. By micromachining such cantilevers with a focused ion beam, we optimized them for SMFS rather than tapping-mode imaging. To enhance usability and throughput, we detected the modified cantilevers on a commercial AFM retrofitted with a detection laser system featuring a 3-μm circular spot size. Moreover, individual cantilevers were reused over multiple days. The improved capabilities of the modified cantilevers for SMFS were showcased by unfolding a polyprotein, a popular biophysical assay. Specifically, these cantilevers maintained a 1-μs response time while eliminating cantilever ringing (Q ≅ 0.5). We therefore expect such cantilevers, along with the instrumentational improvements to detect them on a commercial AFM, to accelerate high-precision AFM-based SMFS studies.

Scanning laser microscope for imaging nanostructured superconductors

International Nuclear Information System (INIS)

Ishida, Takekazu; Arai, Kohei; Akita, Yukio; Miyanari, Mitsunori; Minami, Yusuke; Yotsuya, Tsutomu; Kato, Masaru; Satoh, Kazuo; Uno, Mayumi; Shimakage, Hisashi; Miki, Shigehito; Wang, Zhen

2010-01-01

The nanofabrication of superconductors yields various interesting features in superconducting properties. A variety of different imaging techniques have been developed for probing the local superconducting profiles. A scanning pulsed laser microscope has been developed by the combination of the XYZ piezo-driven stages and an optical fiber with an aspheric focusing lens. The scanning laser microscope is used to understand the position-dependent properties of a superconducting MgB 2 stripline of length 100 μm and width of 3 μm under constant bias current. Our results show that the superconducting stripline can clearly be seen in the contour image of the scanning laser microscope on the signal voltage. It is suggested from the observed image that the inhomogeneity is relevant in specifying the operating conditions such as detection efficiency of the sensor.

Scanning laser microscope for imaging nanostructured superconductors

Science.gov (United States)

Ishida, Takekazu; Arai, Kohei; Akita, Yukio; Miyanari, Mitsunori; Minami, Yusuke; Yotsuya, Tsutomu; Kato, Masaru; Satoh, Kazuo; Uno, Mayumi; Shimakage, Hisashi; Miki, Shigehito; Wang, Zhen

2010-10-01

The nanofabrication of superconductors yields various interesting features in superconducting properties. A variety of different imaging techniques have been developed for probing the local superconducting profiles. A scanning pulsed laser microscope has been developed by the combination of the XYZ piezo-driven stages and an optical fiber with an aspheric focusing lens. The scanning laser microscope is used to understand the position-dependent properties of a superconducting MgB 2 stripline of length 100 μm and width of 3 μm under constant bias current. Our results show that the superconducting stripline can clearly be seen in the contour image of the scanning laser microscope on the signal voltage. It is suggested from the observed image that the inhomogeneity is relevant in specifying the operating conditions such as detection efficiency of the sensor.

Axiomatic electrodynamics and microscopic mechanics

International Nuclear Information System (INIS)

Yussouff, M.

1981-04-01

A new approach to theoretical physics, along with the basic formulation of a new MICROSCOPIC MECHANICS for the motion of small charged particles is described in this set of lecture notes. Starting with the classical (Newtonian) mechanics and classical fields, the important but well known properties of Classical Electromagnetic field are discussed up to section 4. The next nection describes the usual radiation damping theory and its difficulties. It is argued that the usual treatment of radiation damping is not valid for small space and time intervals and the true description of motion requires a new type of mechanics - the MICROSCOPIC MECHANICS: Section 6 and 7 are devoted to showing that not only the new microscopic mechanics goes over to Newtonian mechanics in the proper limit, but also it is closely connected with Quantum Mechanics. All the known results of the Schroedinger theory can be reproduced by microscopic mechanics which also gives a clear physical picture. It removes Einstein's famous objections against Quantum Theory and provides a clear distinction between classical and Quantum behavior. Seven Axioms (three on Classical Mechanics, two for Maxwell's theory, one for Relativity and a new Axiom on Radiation damping) are shown to combine Classical Mechanics, Maxwellian Electrodynamics, Relativity and Schroedinger's Quantum Theory within a single theoretical framework under Microscopic Mechanics which awaits further development at the present time. (orig.)

Sub-nanosecond time-resolved near-field scanning magneto-optical microscope.

Science.gov (United States)

Rudge, J; Xu, H; Kolthammer, J; Hong, Y K; Choi, B C

2015-02-01

We report on the development of a new magnetic microscope, time-resolved near-field scanning magneto-optical microscope, which combines a near-field scanning optical microscope and magneto-optical contrast. By taking advantage of the high temporal resolution of time-resolved Kerr microscope and the sub-wavelength spatial resolution of a near-field microscope, we achieved a temporal resolution of ∼50 ps and a spatial resolution of microscope, the magnetic field pulse induced gyrotropic vortex dynamics occurring in 1 μm diameter, 20 nm thick CoFeB circular disks has been investigated. The microscope provides sub-wavelength resolution magnetic images of the gyrotropic motion of the vortex core at a resonance frequency of ∼240 MHz.

Coffee Cup Atomic Force Microscopy

Science.gov (United States)

Ashkenaz, David E.; Hall, W. Paige; Haynes, Christy L.; Hicks, Erin M.; McFarland, Adam D.; Sherry, Leif J.; Stuart, Douglas A.; Wheeler, Korin E.; Yonzon, Chanda R.; Zhao, Jing; Godwin, Hilary A.; Van Duyne, Richard P.

2010-01-01

In this activity, students use a model created from a coffee cup or cardstock cutout to explore the working principle of an atomic force microscope (AFM). Students manipulate a model of an AFM, using it to examine various objects to retrieve topographic data and then graph and interpret results. The students observe that movement of the AFM…

Analytical Model of the Nonlinear Dynamics of Cantilever Tip-Sample Surface Interactions for Various Acoustic-Atomic Force Microscopies

Science.gov (United States)

Cantrell, John H., Jr.; Cantrell, Sean A.

2008-01-01

A comprehensive analytical model of the interaction of the cantilever tip of the atomic force microscope (AFM) with the sample surface is developed that accounts for the nonlinearity of the tip-surface interaction force. The interaction is modeled as a nonlinear spring coupled at opposite ends to linear springs representing cantilever and sample surface oscillators. The model leads to a pair of coupled nonlinear differential equations that are solved analytically using a standard iteration procedure. Solutions are obtained for the phase and amplitude signals generated by various acoustic-atomic force microscope (A-AFM) techniques including force modulation microscopy, atomic force acoustic microscopy, ultrasonic force microscopy, heterodyne force microscopy, resonant difference-frequency atomic force ultrasonic microscopy (RDF-AFUM), and the commonly used intermittent contact mode (TappingMode) generally available on AFMs. The solutions are used to obtain a quantitative measure of image contrast resulting from variations in the Young modulus of the sample for the amplitude and phase images generated by the A-AFM techniques. Application of the model to RDF-AFUM and intermittent soft contact phase images of LaRC-cp2 polyimide polymer is discussed. The model predicts variations in the Young modulus of the material of 24 percent from the RDF-AFUM image and 18 percent from the intermittent soft contact image. Both predictions are in good agreement with the literature value of 21 percent obtained from independent, macroscopic measurements of sheet polymer material.

Comparative study of image contrast in scanning electron microscope and helium ion microscope.

Science.gov (United States)

O'Connell, R; Chen, Y; Zhang, H; Zhou, Y; Fox, D; Maguire, P; Wang, J J; Rodenburg, C

2017-12-01

Images of Ga + -implanted amorphous silicon layers in a 110 n-type silicon substrate have been collected by a range of detectors in a scanning electron microscope and a helium ion microscope. The effects of the implantation dose and imaging parameters (beam energy, dwell time, etc.) on the image contrast were investigated. We demonstrate a similar relationship for both the helium ion microscope Everhart-Thornley and scanning electron microscope Inlens detectors between the contrast of the images and the Ga + density and imaging parameters. These results also show that dynamic charging effects have a significant impact on the quantification of the helium ion microscope and scanning electron microscope contrast. © 2017 The Authors Journal of Microscopy © 2017 Royal Microscopical Society.

High resolution magnetic force microscopy using focused ion beam modified tips

NARCIS (Netherlands)

Phillips, G.N.; Siekman, Martin Herman; Abelmann, Leon; Lodder, J.C.

2002-01-01

Atomic force microscope tips coated by the thermal evaporation of a magnetic 30 nm thick Co film have been modified by focused ion beam milling with Ga+ ions to produce tips suitable for magnetic force microscopy. Such tips possess a planar magnetic element with high magnetic shape anisotropy, an

Note: A rigid piezo motor with large output force and an effective method to reduce sliding friction force

Energy Technology Data Exchange (ETDEWEB)

Guo, Ying; Lu, Qingyou, E-mail: qxl@ustc.edu.cn [High Magnetic Field Laboratory, Chinese Academy of Sciences and University of Science and Technology of China, Hefei, Anhui 230026 (China); Hefei National Laboratory for Physical Sciences at Microscale, University of Science and Technology of China, Hefei, Anhui 230026 (China); Hou, Yubin [High Magnetic Field Laboratory, Chinese Academy of Sciences and University of Science and Technology of China, Hefei, Anhui 230026 (China)

2014-05-15

We present a completely practical TunaDrive piezo motor. It consists of a central piezo stack sandwiched by two arm piezo stacks and two leg piezo stacks, respectively, which is then sandwiched and spring-clamped by a pair of parallel polished sapphire rods. It works by alternatively fast expanding and contracting the arm/leg stacks while slowly expanding/contracting the central stack simultaneously. The key point is that sufficiently fast expanding and contracting a limb stack can make its two sliding friction forces well cancel, resulting in the total sliding friction force is <10% of the total static friction force, which can help increase output force greatly. The piezo motor's high compactness, precision, and output force make it perfect in building a high-quality harsh-condition (vibration resistant) atomic resolution scanning probe microscope.

Note: A rigid piezo motor with large output force and an effective method to reduce sliding friction force

International Nuclear Information System (INIS)

Guo, Ying; Lu, Qingyou; Hou, Yubin

2014-01-01

We present a completely practical TunaDrive piezo motor. It consists of a central piezo stack sandwiched by two arm piezo stacks and two leg piezo stacks, respectively, which is then sandwiched and spring-clamped by a pair of parallel polished sapphire rods. It works by alternatively fast expanding and contracting the arm/leg stacks while slowly expanding/contracting the central stack simultaneously. The key point is that sufficiently fast expanding and contracting a limb stack can make its two sliding friction forces well cancel, resulting in the total sliding friction force is <10% of the total static friction force, which can help increase output force greatly. The piezo motor's high compactness, precision, and output force make it perfect in building a high-quality harsh-condition (vibration resistant) atomic resolution scanning probe microscope

Task force on resource development and the economy

International Nuclear Information System (INIS)

Mansell, R.L.; Staples, L.B.

2011-02-01

In Alberta, the development and growth of the economy relies heavily on the resource sectors, which drive half of all employment. In 2009, the Alberta Chamber of Resources commissioned a task force, comprising groups from the 9 resource sectors in Alberta, to examine resource development and the economy. The aim of this team was to present the impact that the resource sectors had on Alberta's economy in the past, the impact it could have in the future, and to make recommendations on how to meet the full potential of resource development in the province. This reports states that considerable resources of bitumen and coal are present in Alberta and that forestry and diamonds could also play important roles in future resource development. The task force believes that the resource sectors will continue lead gross domestic product growth in Alberta and 16 recommendations for meeting the province's full potential are provided.

Step-edge calibration of torsional sensitivity for lateral force microscopy

International Nuclear Information System (INIS)

Sul, Onejae; Jang, Seongjin; Yang, Eui-Hyeok

2009-01-01

A novel calibration technique has been developed for lateral force microscopy (LFM). Typically, special preparation of the atomic force microscope (AFM) cantilever or a substrate is required for LFM calibration. The new calibration technique reported in this paper greatly reduces the required preparation processes by simply scanning over a rigid step and measuring the response of the AFM photodiode in the normal and lateral directions. When an AFM tip touches a step while scanning, the tip experiences a reaction force from the step edge, and the amount of torsion can be estimated based on the ratio of the normal and torsional spring constants of an AFM cantilever. Therefore, the torsion can be calibrated using the measured response of the photodiode from the lateral movement of the AFM tip. This new calibration technique has been tested and confirmed by measuring Young's modulus of a nickel (Ni) nanowire

A Derivation of a Microscopic Entropy and Time Irreversibility From the Discreteness of Time

Directory of Open Access Journals (Sweden)

Roland Riek

2014-06-01

Full Text Available The basic microsopic physical laws are time reversible. In contrast, the second law of thermodynamics, which is a macroscopic physical representation of the world, is able to describe irreversible processes in an isolated system through the change of entropy ΔS > 0. It is the attempt of the present manuscript to bridge the microscopic physical world with its macrosocpic one with an alternative approach than the statistical mechanics theory of Gibbs and Boltzmann. It is proposed that time is discrete with constant step size. Its consequence is the presence of time irreversibility at the microscopic level if the present force is of complex nature (F(r ≠ const. In order to compare this discrete time irreversible mechamics (for simplicity a “classical”, single particle in a one dimensional space is selected with its classical Newton analog, time reversibility is reintroduced by scaling the time steps for any given time step n by the variable sn leading to the Nosé-Hoover Lagrangian. The corresponding Nos´e-Hoover Hamiltonian comprises a term Ndf kB T ln sn (kB the Boltzmann constant, T the temperature, and Ndf the number of degrees of freedom which is defined as the microscopic entropy Sn at time point n multiplied by T. Upon ensemble averaging this microscopic entropy Sn in equilibrium for a system which does not have fast changing forces approximates its macroscopic counterpart known from thermodynamics. The presented derivation with the resulting analogy between the ensemble averaged microscopic entropy and its thermodynamic analog suggests that the original description of the entropy by Boltzmann and Gibbs is just an ensemble averaging of the time scaling variable sn which is in equilibrium close to 1, but that the entropy

Study of atomic force microscopy nanoindentation for the development of nanostructures

International Nuclear Information System (INIS)

Sirena, M.; Fusil, S.; Bouzehouane, K.; George, J.-M.; Cros, V.

2009-01-01

We have studied the fabrication of atomic force microscope (AFM) based nanotemplates using electrically controlled indentation (ECI) and a composite barrier (photoresist/alumina) that is resistant to the lithography process and presents good mechanical properties for indentation. The indentation process is affected by several factors such as the indentation speed, the trigger voltage and the barrier type. We have used the nanotemplate technique to fabricate small gold-gold nanocontacts (1-10 nm). In this limit, the size of the contacts that is obtained through the indentation process seems to be stochastic. However, low dimension, clean metallic contacts were achieved with high temporal stability and compatible with low temperature measurements. The fabricated nanotemplates are versatile and can be used in a wide range of applications, from nanojunctions to connecting a single nano-object. Small area metallic contacts can be used to study spin injection or ballistic transport.

Study of atomic force microscopy nanoindentation for the development of nanostructures

Energy Technology Data Exchange (ETDEWEB)

Sirena, M., E-mail: sirena@cab.cnea.gov.a [Unite Mixte de Physique CNRS/Thales, Campus de Polytechnique. 1 Avenue A. Fresnel, 91767 Palaiseau (France); Fusil, S. [Universite d' Evry, Batiment des Sciences, rue du pere Jarlan, 91205 Every (France); Bouzehouane, K.; George, J.-M.; Cros, V. [Unite Mixte de Physique CNRS/Thales, Campus de Polytechnique. 1 Avenue A. Fresnel, 91767 Palaiseau (France)

2009-10-01

We have studied the fabrication of atomic force microscope (AFM) based nanotemplates using electrically controlled indentation (ECI) and a composite barrier (photoresist/alumina) that is resistant to the lithography process and presents good mechanical properties for indentation. The indentation process is affected by several factors such as the indentation speed, the trigger voltage and the barrier type. We have used the nanotemplate technique to fabricate small gold-gold nanocontacts (1-10 nm). In this limit, the size of the contacts that is obtained through the indentation process seems to be stochastic. However, low dimension, clean metallic contacts were achieved with high temporal stability and compatible with low temperature measurements. The fabricated nanotemplates are versatile and can be used in a wide range of applications, from nanojunctions to connecting a single nano-object. Small area metallic contacts can be used to study spin injection or ballistic transport.

Proton microscope design for 9 GeV pRad facility

International Nuclear Information System (INIS)

Barminova, H.Y.; Turtikov, V.I.

2016-01-01

The proton microscope design for 9 GeV proton radiography facility is described. Basic principles of proton microscope development are discussed. Two variants of microscope optical scheme are proposed. Simulation of the proton beam dynamics is carried out, the results showing the possibility to obtain the microscope spatial resolution not worse than 10 μ m.

Microscopic Mechanisms of Dissolution-Precipitation at the Water-Manganese Mineral Interfaces

Science.gov (United States)

Jun, Y.; Martin, S. T.

2006-12-01

The fate and transport of metal contaminants in water are often affected by the manganese redox cycling and the accompanying dissolution and precipitation reactions. Direct microscopic observations of such dynamic reactions, however, are sparse. In this work, microscopic mechanisms of simultaneous dissolution and precipitation of manganese minerals is studied by atomic force microscope (AFM) at circumneutral pH. The effects of the substrate surface morphology, the substrate atomic structure, and the aqueous concentration of Mn2+ on the formation of Mn oxide islands are investigated. Under oxic conditions, Mn2+(aq) dissolved from MnCO3 surface is reacted with O2(aq) at circumneutral pH to form Mn oxide islands on the (10-14) surface of MnCO3. The Mn oxide islands grow heteroepitaxially. On terraces, rhombohedral islands form with 90° rotation relative to crystallographic axis of the underlying substrate, and with z-directional self-limitation. Comparison studies done with MgCO3 and CaCO3 show that the former also promotes heteroepitaxial growth whereas the latter does not. This difference is explained by the relative bond length mismatch between the structures of the carbonate substrates and the atomic structures of Mn oxide islands. A free energy model is also employed to explain why the heights of the Mn oxide islands self limit. Our results provide an improved understanding for the development of predictive models both of exchange across the sediment-water interfaces and the fate and transport of contaminants in aqueous environments.

Microscopic modeling of multi-lane highway traffic flow

Science.gov (United States)

Hodas, Nathan O.; Jagota, Anand

2003-12-01

We discuss a microscopic model for the study of multi-lane highway traffic flow dynamics. Each car experiences a force resulting from a combination of the desire of the driver to attain a certain velocity, aerodynamic drag, and change of the force due to car-car interactions. The model also includes multi-lane simulation capability and the ability to add and remove obstructions. We implement the model via a Java applet, which is used to simulate traffic jam formation, the effect of bottlenecks on traffic flow, and the existence of light, medium, and heavy traffic flow. The simulations also provide insight into how the properties of individual cars result in macroscopic behavior. Because the investigation of emergent characteristics is so common in physics, the study of traffic in this manner sheds new light on how the micro-to-macro transition works in general.

Force-controlled patch clamp of beating cardiac cells.

Science.gov (United States)

Ossola, Dario; Amarouch, Mohamed-Yassine; Behr, Pascal; Vörös, János; Abriel, Hugues; Zambelli, Tomaso

2015-03-11

From its invention in the 1970s, the patch clamp technique is the gold standard in electrophysiology research and drug screening because it is the only tool enabling accurate investigation of voltage-gated ion channels, which are responsible for action potentials. Because of its key role in drug screening, innovation efforts are being made to reduce its complexity toward more automated systems. While some of these new approaches are being adopted in pharmaceutical companies, conventional patch-clamp remains unmatched in fundamental research due to its versatility. Here, we merged the patch clamp and atomic force microscope (AFM) techniques, thus equipping the patch-clamp with the sensitive AFM force control. This was possible using the FluidFM, a force-controlled nanopipette based on microchanneled AFM cantilevers. First, the compatibility of the system with patch-clamp electronics and its ability to record the activity of voltage-gated ion channels in whole-cell configuration was demonstrated with sodium (NaV1.5) channels. Second, we showed the feasibility of simultaneous recording of membrane current and force development during contraction of isolated cardiomyocytes. Force feedback allowed for a gentle and stable contact between AFM tip and cell membrane enabling serial patch clamping and injection without apparent cell damage.

A transmission positron microscope and a scanning positron microscope being built at KEK, Japan

International Nuclear Information System (INIS)

Doyama, M.; Inoue, M.; Kogure, Y.; Kurihara, T.; Yagishita, A.; Shidara, T.; Nakahara, K.; Hayashi, Y.; Yoshiie, T.

2001-01-01

This paper reports the plans of positron microscopes being built at KEK (High Energy Accelerator Research Organization), Tsukuba, Japan improving used electron microscopes. The kinetic energies of positron produced by accelerators or by nuclear decays have not a unique value but show a spread over in a wide range. Positron beam will be guided near electron microscopes, a transmission electron microscope (JEM100S) and a scanning electron microscope (JSM25S). Positrons are slowed down by a tungsten foil, accelerated and focused on a nickel sheet. The monochromatic focused beam will be injected into an electron microscope. The focusing of positrons and electrons is achieved by magnetic system of the electron microscopes. Imaging plates are used to record positron images for the transmission electron microscope. (orig.)

Rate turnover in mechano-catalytic coupling: A model and its microscopic origin

Energy Technology Data Exchange (ETDEWEB)

Roy, Mahua; Grazioli, Gianmarc; Andricioaei, Ioan, E-mail: andricio@uci.edu [Department of Chemistry, University of California, Irvine, California 92697 (United States)

2015-07-28

A novel aspect in the area of mechano-chemistry concerns the effect of external forces on enzyme activity, i.e., the existence of mechano-catalytic coupling. Recent experiments on enzyme-catalyzed disulphide bond reduction in proteins under the effect of a force applied on the termini of the protein substrate reveal an unexpected biphasic force dependence for the bond cleavage rate. Here, using atomistic molecular dynamics simulations combined with Smoluchowski theory, we propose a model for this behavior. For a broad range of forces and systems, the model reproduces the experimentally observed rates by solving a reaction-diffusion equation for a “protein coordinate” diffusing in a force-dependent effective potential. The atomistic simulations are used to compute, from first principles, the parameters of the model via a quasiharmonic analysis. Additionally, the simulations are also used to provide details about the microscopic degrees of freedom that are important for the underlying mechano-catalysis.

Rate turnover in mechano-catalytic coupling: A model and its microscopic origin

International Nuclear Information System (INIS)

Roy, Mahua; Grazioli, Gianmarc; Andricioaei, Ioan

2015-01-01

A novel aspect in the area of mechano-chemistry concerns the effect of external forces on enzyme activity, i.e., the existence of mechano-catalytic coupling. Recent experiments on enzyme-catalyzed disulphide bond reduction in proteins under the effect of a force applied on the termini of the protein substrate reveal an unexpected biphasic force dependence for the bond cleavage rate. Here, using atomistic molecular dynamics simulations combined with Smoluchowski theory, we propose a model for this behavior. For a broad range of forces and systems, the model reproduces the experimentally observed rates by solving a reaction-diffusion equation for a “protein coordinate” diffusing in a force-dependent effective potential. The atomistic simulations are used to compute, from first principles, the parameters of the model via a quasiharmonic analysis. Additionally, the simulations are also used to provide details about the microscopic degrees of freedom that are important for the underlying mechano-catalysis

New force replica exchange method and protein folding pathways probed by force-clamp technique.

Science.gov (United States)

Kouza, Maksim; Hu, Chin-Kun; Li, Mai Suan

2008-01-28

We have developed a new extended replica exchange method to study thermodynamics of a system in the presence of external force. Our idea is based on the exchange between different force replicas to accelerate the equilibrium process. This new approach was applied to obtain the force-temperature phase diagram and other thermodynamical quantities of the three-domain ubiquitin. Using the C(alpha)-Go model and the Langevin dynamics, we have shown that the refolding pathways of single ubiquitin depend on which terminus is fixed. If the N end is fixed then the folding pathways are different compared to the case when both termini are free, but fixing the C terminal does not change them. Surprisingly, we have found that the anchoring terminal does not affect the pathways of individual secondary structures of three-domain ubiquitin, indicating the important role of the multidomain construction. Therefore, force-clamp experiments, in which one end of a protein is kept fixed, can probe the refolding pathways of a single free-end ubiquitin if one uses either the polyubiquitin or a single domain with the C terminus anchored. However, it is shown that anchoring one end does not affect refolding pathways of the titin domain I27, and the force-clamp spectroscopy is always capable to predict folding sequencing of this protein. We have obtained the reasonable estimate for unfolding barrier of ubiquitin, using the microscopic theory for the dependence of unfolding time on the external force. The linkage between residue Lys48 and the C terminal of ubiquitin is found to have the dramatic effect on the location of the transition state along the end-to-end distance reaction coordinate, but the multidomain construction leaves the transition state almost unchanged. We have found that the maximum force in the force-extension profile from constant velocity force pulling simulations depends on temperature nonlinearly. However, for some narrow temperature interval this dependence becomes

Dynamic steering beams for efficient force measurement in optical manipulation

Institute of Scientific and Technical Information of China (English)

Xiaocong Yuan; Yuquan Zhang; Rui Cao; Xing Zhao; Jing Bu; Siwei Zhu

2011-01-01

@@ An efficient and inexpensive method that uses a glass plate mounted onto a motorized rotating stage as a beam-steering device for the generation of dynamic optical traps is reported.Force analysis reveals that there are drag and trapping forces imposed on the bead in the opposite directions, respectively, in a viscous medium.The trapped bead will be rotated following the beam's motion before it reaches the critical escape velocity when the drag force is equal to the optical trapping force.The equilibrium condition facilitates the experimental measurement of the drag force with potential extensions to the determination of the viscosity of the medium or the refractive index of the bead.The proposed technique can easily be integrated into conventional optical microscopic systems with minimum modifications.%An efficient and inexpensive method that uses a glass plate mounted onto a motorized rotating stage as a beam-steering device for the generation of dynamic optical traps is reported. Force analysis reveals that there are drag and trapping forces imposed on the bead in the opposite directions, respectively, in a viscous medium. The trapped bead will be rotated following the beam's motion before it reaches the critical escape velocity when the drag force is equal to the optical trapping force. The equilibrium condition facilitates the experimental measurement of the drag force with potential extensions to the determination of the viscosity of the medium or the refractive index of the bead. The proposed technique can easily be integrated into conventional optical microscopic systems with minimum modifications.

Development and trial measurement of synchrotron-radiation-light-illuminated scanning tunneling microscope

International Nuclear Information System (INIS)

Matsushima, Takeshi; Okuda, Taichi; Eguchi, Toyoaki; Ono, Masanori; Harasawa, Ayumi; Wakita, Takanori; Kataoka, Akira; Hamada, Masayuki; Kamoshida, Atsushi; Hasegawa, Yukio; Kinoshita, Toyohiko

2004-01-01

Scanning tunneling microscope (STM) study is performed under synchrotron-radiation-light illumination. The equipment is designed so as to achieve atomic resolution even under rather noisy conditions in the synchrotron radiation facility. By measuring photoexcited electron current by the STM tip together with the conventional STM tunneling current, Si 2p soft-x-ray absorption spectra are successfully obtained from a small area of Si(111) surface. The results are a first step toward realizing a new element-specific microscope

Driving forces and barriers for environmental technology development

International Nuclear Information System (INIS)

2005-01-01

Driving forces and barriers behind development and usage of environmental technology is discussed, and also whether there are certain characteristics related to environmental innovations compared to other innovations in general. The development of environmental technology is in principle dominated by the same drivers and barriers as any other technology, but the order and strength of the various factors may be different. This examination as well as other empirical studies shows that regulations play a greater part for environmental technology than 'pure market forces'. To many participants it is important to be one step ahead of the regulations, i.e. the expected regulations are equally important as the factual ones in driving the technology development. Players in the business community express that it is important that the authorities cooperate with them when introducing new regulations. This will increase acceptance for the regulations and facilitate the necessary adjustments. The most important barrier in the development and use of the technologies studied is probably the lack of demand

Contrast and resolution enhancement of a near-field optical microscope by using a modulation technique

International Nuclear Information System (INIS)

Flaxer, Eli; Palachi, Eldad

2005-01-01

A new design of a tunneling near-field optical microscope (TNOM) combined with an atomic force microscope (AFM) is presented. This design can be used to generate three different images of the sample's surface: a non-contact (tapping mode) AFM image, a conventional TNOM and an image of a modulation signal of the conventional TNOM, which we call AC-TNOM. The images are obtained simultaneously, using a single light source. It is shown that the AC-TNOM has better resolution (∼200 A) and contrast compared to conventional TNOM (∼400 A)

Early and Late Rate of Force Development

DEFF Research Database (Denmark)

Andersen, Lars L; Andersen, Jesper L; Zebis, Mette K

2010-01-01

The objective of this study is to investigate the potentially opposing influence of qualitative and quantitative muscular adaptations in response to high-intensity resistance training on contractile rate of force development (RFD) in the early (<100 ms) and later phases (>200 ms) of rising muscle...

Study of the mapping mechanism of ferroelectric domains with the scanning force microscope; Untersuchung der Abbildungsmechanismen ferroelektrischer Domaenen mit dem Rasterkraftmikroskop

Energy Technology Data Exchange (ETDEWEB)

Jungk, T.

2006-12-15

The piezo-force microscopy (PFM) allows the mapping of ferroelectric domains until the nanometer range. In spite of its simple function principle it was hitherto not completely understood. In ordser to develop the PFM further to a quantitative analysis method its methodical aspects were analyzed. It was shown that the fundamental mapping mechanism is based on the inverse piezo-effect. Different artefacts to be found in the literature could therefore be reduced to a measurement background. Furthermore the influence of the electrode geometry was analyzed. The width of doamin walls was systematically measured and simulated with a mode, whereby a maximal resolution of 17 nm was reached. By the development of a correction procedure for the exact detection of the forces acting on the spring-beam the lateral signals measured on domain walls could by newly interpreted. So the ''Lateral Electrostatic Force Microscopy'' was developed.

Application fo tunneling and atomic force detection to machines and scientific instruments. Tunnel gensho ya genshikan no mechatronics eno oyo

Energy Technology Data Exchange (ETDEWEB)

Kawakatsu, H. (The University of Tokyo, Tokyo (Japan). Institute of Industrial Science)

1991-11-01

It is now about ten years since the scanning tunnel microscope (STM) and the atomic force microscope (AFM) were invented. These microscopes are used very importantly today as a surface analyzer capable of atomic order analysis for their very high resolution. The STM and AFM obtain images of atomic orders by means of mechanical scanning of the probes. This means that the microscopes can control positioning, force detection and displacement in regions of sub-nanometer orders. Examples of researches may include detection of acceleration, length measurement, positioning, force detection, nano-tripology, processing and gravitational wave detection. As described above, this paper notes the researches derived from the operational principles of the STM and AFM, rather than the researches on the observation objects. The great diversity of the researches taken up and the greatness in the number of researches in the STM and AFM gather how superbly germinative these were. 34 refs.

Contrast artifacts in tapping tip atomic force microscopy

DEFF Research Database (Denmark)

Kyhle, Anders; Sørensen, Alexis Hammer; Zandbergen, Julie Bjerring

1998-01-01

When recording images with an atomic force microscope using the resonant vibrating cantilever mode, surprising strange results are often achieved. Typical artifacts are strange contours, unexpected height shifts, and sudden changes of the apparent resolution in the acquired images. Such artifacts...

Development of micro-four-point probe in a scanning tunneling microscope for in situ electrical transport measurement.

Science.gov (United States)

Ge, Jian-Feng; Liu, Zhi-Long; Gao, Chun-Lei; Qian, Dong; Liu, Canhua; Jia, Jin-Feng

2015-05-01

Electrons at surface may behave differently from those in bulk of a material. Multi-functional tools are essential in comprehensive studies on a crystal surface. Here, we developed an in situ microscopic four-point probe (4PP) transport measurement system on the basis of a scanning tunneling microscope (STM). In particular, convenient replacement between STM tips and micro-4PPs enables systematic investigations of surface morphology, electronic structure, and electrical transport property of a same sample surface. Performances of the instrument are demonstrated with high-quality STM images, tunneling spectra, and low-noise electrical I-V characteristic curves of a single-layer FeSe film grown on a conductive SrTiO3 surface.

Development of micro-four-point probe in a scanning tunneling microscope for in situ electrical transport measurement

Energy Technology Data Exchange (ETDEWEB)

Ge, Jian-Feng; Liu, Zhi-Long; Gao, Chun-Lei; Qian, Dong; Liu, Canhua, E-mail: canhualiu@sjtu.edu.cn, E-mail: jfjia@sjtu.edu.cn; Jia, Jin-Feng, E-mail: canhualiu@sjtu.edu.cn, E-mail: jfjia@sjtu.edu.cn [Key Laboratory of Artificial Structures and Quantum Control (Ministry of Education), Department of Physics and Astronomy, Shanghai Jiao Tong University, 800 Dongchuan Road, Shanghai 200240 (China)

2015-05-15

Electrons at surface may behave differently from those in bulk of a material. Multi-functional tools are essential in comprehensive studies on a crystal surface. Here, we developed an in situ microscopic four-point probe (4PP) transport measurement system on the basis of a scanning tunneling microscope (STM). In particular, convenient replacement between STM tips and micro-4PPs enables systematic investigations of surface morphology, electronic structure, and electrical transport property of a same sample surface. Performances of the instrument are demonstrated with high-quality STM images, tunneling spectra, and low-noise electrical I-V characteristic curves of a single-layer FeSe film grown on a conductive SrTiO{sub 3} surface.

Optical modeling of Fresnel zoneplate microscopes

International Nuclear Information System (INIS)

Naulleau, Patrick P.; Mochi, Iacopo; Goldberg, Kenneth A.

2011-01-01

Defect free masks remain one of the most significant challenges facing the commercialization of extreme ultraviolet (EUV) lithography. Progress on this front requires high-performance wavelength-specific metrology of EUV masks, including high-resolution and aerial-image microscopy performed near the 13.5 nm wavelength. Arguably the most cost-effective and rapid path to proliferating this capability is through the development of Fresnel zoneplate-based microscopes. Given the relative obscurity of such systems, however, modeling tools are not necessarily optimized to deal with them and their imaging properties are poorly understood. Here we present a modeling methodology to analyze zoneplate microscopes based on commercially available optical modeling software and use the technique to investigate the imaging performance of an off-axis EUV microscope design. The modeling predicts that superior performance can be achieved by tilting the zoneplate, making it perpendicular to the chief ray at the center of the field, while designing the zoneplate to explicitly work in that tilted plane. Although the examples presented here are in the realm of EUV mask inspection, the methods described and analysis results are broadly applicable to zoneplate microscopes in general, including full-field soft-x-ray microscopes routinely used in the synchrotron community.

Multispectral Video-Microscope Modified for Skin Diagnostics

Directory of Open Access Journals (Sweden)

Rubins U.

2014-12-01

Full Text Available Commercial DinoLite AD413 digital microscope was modified for skin diagnostics purposes. The original LED ring (4 white and 4 ultraviolet light emitters of microscope was replaced by a custom-designed 16-LED ring module consisting of four LED groups (450, 545, 660 and 940 nm, and an onboard LED controller with USB hub was added. The video acquisition and LED switching are performed using custom-designed Matlab software which provides real-time spectral analysis of multi-spectral images and calculation of skin chromophore optical density. The developed multispectral video-microscope is mainly meant for diagnostics of skin malformations, e.g. skin cancerous lesions.

Modular Organization of Exploratory Force Development Under Isometric Conditions in the Human Arm.

Science.gov (United States)

Roh, Jinsook; Lee, Sang Wook; Wilger, Kevin D

2018-01-31

Muscle coordination of isometric force production can be explained by a smaller number of modules. Variability in force output, however, is higher during exploratory/transient force development phases than force maintenance phase, and it is not clear whether the same modular structure underlies both phases. In this study, eight neurologically-intact adults isometrically performed target force matches in 54 directions at hands, and electromyographic (EMG) data from eight muscles were parsed into four sequential phases. Despite the varying degree of motor complexity across phases (significant between-phase differences in EMG-force correlation, angular errors, and between-force correlations), the number/composition of motor modules were found equivalent across phases, suggesting that the CNS systematically modulated activation of the same set of motor modules throughout sequential force development.

Scanning differential polarization microscope: Its use to image linear and circular differential scattering

International Nuclear Information System (INIS)

Mickols, W.; Maestre, M.F.

1988-01-01

A differential polarization microscope that couples the sensitivity of single-beam measurement of circular dichroism and circular differential scattering with the simultaneous measurement of linear dichroism and linear differential scattering has been developed. The microscope uses a scanning microscope stage and single-point illumination to give the very shallow depth of field found in confocal microscopy. This microscope can operate in the confocal mode as well as in the near confocal condition that can allow one to program the coherence and spatial resolution of the microscope. This microscope has been used to study the change in the structure of chromatin during the development of sperm in Drosophila

Measuring adhesion on rough surfaces using atomic force microscopy with a liquid probe

Directory of Open Access Journals (Sweden)

Juan V. Escobar

2017-04-01

Full Text Available We present a procedure to perform and interpret pull-off force measurements during the jump-off-contact process between a liquid drop and rough surfaces using a conventional atomic force microscope. In this method, a micrometric liquid mercury drop is attached to an AFM tipless cantilever to measure the force required to pull this drop off a rough surface. We test the method with two surfaces: a square array of nanometer-sized peaks commonly used for the determination of AFM tip sharpness and a multi-scaled rough diamond surface containing sub-micrometer protrusions. Measurements are carried out in a nitrogen atmosphere to avoid water capillary interactions. We obtain information about the average force of adhesion between a single peak or protrusion and the liquid drop. This procedure could provide useful microscopic information to improve our understanding of wetting phenomena on rough surfaces.

Energy profile of nanobody-GFP complex under force

Science.gov (United States)

Klamecka, Kamila; Severin, Philip M.; Milles, Lukas F.; Gaub, Hermann E.; Leonhardt, Heinrich

2015-10-01

Nanobodies (Nbs)—the smallest known fully functional and naturally occuring antigen-binding fragments—have attracted a lot of attention throughout the last two decades. Exploring their potential beyond the current use requires more detailed characterization of their binding forces as those cannot be directly derived from the binding affinities. Here we used atomic force microscope to measure rupture force of the Nb-green fluorescent protein (GFP) complex in various pulling geometries and derived the energy profile characterizing the interaction along the direction of the pulling force. We found that—despite identical epitopes—the Nb binds stronger (41-56 pN) to enhanced GFP than to wild-type GFP (28-45 pN). Measured forces make the Nb-GFP pair a potent reference for investigating molecular forces in living systems both in and ex vivo.

Energy profile of nanobody-GFP complex under force.

Science.gov (United States)

Klamecka, Kamila; Severin, Philip M; Milles, Lukas F; Gaub, Hermann E; Leonhardt, Heinrich

2015-09-10

Nanobodies (Nbs)-the smallest known fully functional and naturally occuring antigen-binding fragments-have attracted a lot of attention throughout the last two decades. Exploring their potential beyond the current use requires more detailed characterization of their binding forces as those cannot be directly derived from the binding affinities. Here we used atomic force microscope to measure rupture force of the Nb-green fluorescent protein (GFP) complex in various pulling geometries and derived the energy profile characterizing the interaction along the direction of the pulling force. We found that-despite identical epitopes-the Nb binds stronger (41-56 pN) to enhanced GFP than to wild-type GFP (28-45 pN). Measured forces make the Nb-GFP pair a potent reference for investigating molecular forces in living systems both in and ex vivo.

Laser-induced surface deformation microscope for the study of the dynamic viscoelasticity of plasma membrane in a living cell.

Science.gov (United States)

Morisaku, Toshinori; Yui, Hiroharu

2018-05-15

A laser-induced surface deformation (LISD) microscope is developed and applied to measurement of the dynamic relaxation responses of the plasma membrane in a living cell. A laser beam is tightly focused on an optional area of cell surface and the focused light induces microscopic deformation on the surface via radiation pressure. The LISD microscope not only allows non-contact and destruction-free measurement but provides power spectra of the surface responses depending on the frequency of the intensity of the laser beam. An optical system for the LISD is equipped via a microscope, allowing us to measure the relaxation responses in sub-cellular-sized regions of the plasma membrane. In addition, the forced oscillation caused by the radiation pressure for surface deformation extends the upper limit of the frequency range in the obtained power spectra to 106 Hz, which enables us to measure relaxation responses in local regions within the plasma membrane. From differences in power-law exponents at higher frequencies, it is realized that a cancerous cell obeys a weaker single power-law than a normal fibroblast cell. Furthermore, the power spectrum of a keratinocyte cell obeys a power-law with two exponents, indicating that alternative mechanical models to a conventional soft glassy rheology model (where single power-laws explain cells' responses below about 103 Hz) are needed for the understanding over a wider frequency range. The LISD microscope would contribute to investigation of microscopic cell rheology, which is important for clarifying the mechanisms of cell migration and tissue construction.

Scrambled eggs: mechanical forces as ecological factors in early development.

Science.gov (United States)

Moore, Steven W

2003-01-01

Many ecological interactions involve, at some level, mechanical forces and the movements or structural deformations they produce. Although the most familiar examples involve the functional morphology of adult structures, all life history stages (not just the adults) are subject to the laws of physics. Moreover, the success of every lineage depends on the success of every life history stage (again, not just the adults). Therefore, insights gained by using mechanical engineering principles and techniques to study ecological interactions between gametes, embryos, larvae, and their environment are essential to a well-rounded understanding of development, ecology, and evolution. Here I draw on examples from the literature and my own research to illustrate ways in which mechanical forces in the environment shape development. These include mechanical forces acting as selective factors (e.g., when coral gamete size and shape interact with turbulent water flow to determine fertilization success) and as developmental cues (e.g., when plant growth responds to gravity or bone growth responds to mechanical loading). I also examine the opposite cause-and-effect relationship by considering examples in which the development of organisms impacts ecologically relevant mechanical forces. Finally, I discuss the potential for ecological pattern formation as a result of feedback loops created by such bidirectional interactions between developmental processes and mechanical forces in the environment.

Designs for a quantum electron microscope

Energy Technology Data Exchange (ETDEWEB)

Kruit, P., E-mail: p.kruit@tudelft.nl [Department of Imaging Physics, Delft University of Technology, Lorentzweg 1, 2628CJ Delft (Netherlands); Hobbs, R.G.; Kim, C-S.; Yang, Y.; Manfrinato, V.R. [Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139 (United States); Hammer, J.; Thomas, S.; Weber, P. [Department of Physics, Friedrich Alexander University Erlangen-Nürnberg (FAU), Staudtstrasse 1, d-91058 Erlangen (Germany); Klopfer, B.; Kohstall, C.; Juffmann, T.; Kasevich, M.A. [Department of Physics, Stanford University, Stanford, California 94305 (United States); Hommelhoff, P. [Department of Physics, Friedrich Alexander University Erlangen-Nürnberg (FAU), Staudtstrasse 1, d-91058 Erlangen (Germany); Berggren, K.K. [Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139 (United States)

2016-05-15

One of the astounding consequences of quantum mechanics is that it allows the detection of a target using an incident probe, with only a low probability of interaction of the probe and the target. This ‘quantum weirdness’ could be applied in the field of electron microscopy to generate images of beam-sensitive specimens with substantially reduced damage to the specimen. A reduction of beam-induced damage to specimens is especially of great importance if it can enable imaging of biological specimens with atomic resolution. Following a recent suggestion that interaction-free measurements are possible with electrons, we now analyze the difficulties of actually building an atomic resolution interaction-free electron microscope, or “quantum electron microscope”. A quantum electron microscope would require a number of unique components not found in conventional transmission electron microscopes. These components include a coherent electron beam-splitter or two-state-coupler, and a resonator structure to allow each electron to interrogate the specimen multiple times, thus supporting high success probabilities for interaction-free detection of the specimen. Different system designs are presented here, which are based on four different choices of two-state-couplers: a thin crystal, a grating mirror, a standing light wave and an electro-dynamical pseudopotential. Challenges for the detailed electron optical design are identified as future directions for development. While it is concluded that it should be possible to build an atomic resolution quantum electron microscope, we have also identified a number of hurdles to the development of such a microscope and further theoretical investigations that will be required to enable a complete interpretation of the images produced by such a microscope. - Highlights: • Quantum electron microscopy has the potential of reducing radiation damage. • QEM requires a fraction of the electron wave to pass through the sample

Designs for a quantum electron microscope

International Nuclear Information System (INIS)

Kruit, P.; Hobbs, R.G.; Kim, C-S.; Yang, Y.; Manfrinato, V.R.; Hammer, J.; Thomas, S.; Weber, P.; Klopfer, B.; Kohstall, C.; Juffmann, T.; Kasevich, M.A.; Hommelhoff, P.; Berggren, K.K.

2016-01-01

One of the astounding consequences of quantum mechanics is that it allows the detection of a target using an incident probe, with only a low probability of interaction of the probe and the target. This ‘quantum weirdness’ could be applied in the field of electron microscopy to generate images of beam-sensitive specimens with substantially reduced damage to the specimen. A reduction of beam-induced damage to specimens is especially of great importance if it can enable imaging of biological specimens with atomic resolution. Following a recent suggestion that interaction-free measurements are possible with electrons, we now analyze the difficulties of actually building an atomic resolution interaction-free electron microscope, or “quantum electron microscope”. A quantum electron microscope would require a number of unique components not found in conventional transmission electron microscopes. These components include a coherent electron beam-splitter or two-state-coupler, and a resonator structure to allow each electron to interrogate the specimen multiple times, thus supporting high success probabilities for interaction-free detection of the specimen. Different system designs are presented here, which are based on four different choices of two-state-couplers: a thin crystal, a grating mirror, a standing light wave and an electro-dynamical pseudopotential. Challenges for the detailed electron optical design are identified as future directions for development. While it is concluded that it should be possible to build an atomic resolution quantum electron microscope, we have also identified a number of hurdles to the development of such a microscope and further theoretical investigations that will be required to enable a complete interpretation of the images produced by such a microscope. - Highlights: • Quantum electron microscopy has the potential of reducing radiation damage. • QEM requires a fraction of the electron wave to pass through the sample

Characterization of Line Nanopatterns on Positive Photoresist Produced by Scanning Near-Field Optical Microscope

Directory of Open Access Journals (Sweden)

Sadegh Mehdi Aghaei

2015-01-01

Full Text Available Line nanopatterns are produced on the positive photoresist by scanning near-field optical microscope (SNOM. A laser diode with a wavelength of 450 nm and a power of 250 mW as the light source and an aluminum coated nanoprobe with a 70 nm aperture at the tip apex have been employed. A neutral density filter has been used to control the exposure power of the photoresist. It is found that the changes induced by light in the photoresist can be detected by in situ shear force microscopy (ShFM, before the development of the photoresist. Scanning electron microscope (SEM images of the developed photoresist have been used to optimize the scanning speed and the power required for exposure, in order to minimize the final line width. It is shown that nanometric lines with a minimum width of 33 nm can be achieved with a scanning speed of 75 µm/s and a laser power of 113 mW. It is also revealed that the overexposure of the photoresist by continuous wave laser generated heat can be prevented by means of proper photoresist selection. In addition, the effects of multiple exposures of nanopatterns on their width and depth are investigated.

Development of a super-resolution optical microscope for directional dark matter search experiment

International Nuclear Information System (INIS)

Alexandrov, A.; Asada, T.; Consiglio, L.; D'Ambrosio, N.; De Lellis, G.; Di Crescenzo, A.; Di Marco, N.; Furuya, S.; Hakamata, K.; Ishikawa, M.; Katsuragawa, T.; Kuwabara, K.; Machii, S.; Naka, T.; Pupilli, F.; Sirignano, C.; Tawara, Y.; Tioukov, V.; Umemoto, A.; Yoshimoto, M.

2016-01-01

Nuclear emulsion is a perfect choice for a detector for directional DM search because of its high density and excellent position accuracy. The minimal detectable track length of a recoil nucleus in emulsion is required to be at least 100 nm, making the resolution of conventional optical microscopes insufficient to resolve them. Here we report about the R&D on a super-resolution optical microscope to be used in future directional DM search experiments with nuclear emulsion as a detector media. The microscope will be fully automatic, will use novel image acquisition and analysis techniques, will achieve the spatial resolution of the order of few tens of nm and will be capable of reconstructing recoil tracks with the length of at least 100 nm with high angular resolution.

Contributions of developed and developing countries to global climate forcing and surface temperature change

International Nuclear Information System (INIS)

Ward, D S; Mahowald, N M

2014-01-01

Understanding the relative contributions of individual countries to global climate change for different time periods is essential for mitigation strategies that seek to hold nations accountable for their historical emissions. Previous assessments of this kind have compared countries by their greenhouse gas emissions, but have yet to consider the full spectrum of the short-lived gases and aerosols. In this study, we use the radiative forcing of anthropogenic emissions of long-lived greenhouse gases, ozone precursors, aerosols, and from albedo changes from land cover change together with a simple climate model to evaluate country contributions to climate change. We assess the historical contribution of each country to global surface temperature change from anthropogenic forcing ( Δ T s ), future Δ T s through year 2100 given two different emissions scenarios, and the Δ T s that each country has committed to from past activities between 1850 and 2010 (committed Δ T s ). By including forcings in addition to the long-lived greenhouse gases the contribution of developed countries, particularly the United States, to Δ T s from 1850 to 2010 (58%) is increased compared to an assessment of CO 2 -equivalent emissions for the same time period (52%). Contributions to committed Δ T s evaluated at year 2100, dominated by long-lived greenhouse gas forcing, are more evenly split between developed and developing countries (55% and 45%, respectively). The portion of anthropogenic Δ T s attributable to developing countries is increasing, led by emissions from China and India, and we estimate that this will surpass the contribution from developed countries around year 2030. (paper)

Multiplexed single-molecule force spectroscopy using a centrifuge.

Science.gov (United States)

Yang, Darren; Ward, Andrew; Halvorsen, Ken; Wong, Wesley P

2016-03-17

We present a miniature centrifuge force microscope (CFM) that repurposes a benchtop centrifuge for high-throughput single-molecule experiments with high-resolution particle tracking, a large force range, temperature control and simple push-button operation. Incorporating DNA nanoswitches to enable repeated interrogation by force of single molecular pairs, we demonstrate increased throughput, reliability and the ability to characterize population heterogeneity. We perform spatiotemporally multiplexed experiments to collect 1,863 bond rupture statistics from 538 traceable molecular pairs in a single experiment, and show that 2 populations of DNA zippers can be distinguished using per-molecule statistics to reduce noise.

Origin of current-induced forces in an atomic gold wire: A first-principles study

DEFF Research Database (Denmark)

Brandbyge, Mads; Stokbro, Kurt; Taylor, Jeremy Philip

2003-01-01

We address the microscopic origin of the current-induced forces by analyzing results of first principles density functional calculations of atomic gold wires connected to two gold electrodes with different electrochemical potentials. We find that current induced forces are closely related...

75 FR 24781 - Task Force on Space Industry Workforce and Economic Development

Science.gov (United States)

2010-05-06

... economic and workforce-development efforts through a Task Force composed of senior-level Administration... officials on existing committees or task forces addressing technological development, research, or aerospace... Office of Management and Budget relating to budgetary, administrative, or legislative proposals. (c) This...

A Development of Force Plate for Biomechanics Analysis of Standing and Walking

Science.gov (United States)

Wardoyo, S.; Hutajulu, P. T.; Togibasa, O.

2016-08-01

Force plates are known as an excellent teaching aid to demonstrate the kinematics and dynamics of motion and commonly used in biomechanics laboratories to measure ground forces involved in the motion of human. It is consist of a metal plate with sensors attached to give an electrical output proportional to the force on the plate. Moreover, force plates are useful for examining the kinetic characteristics of an athlete's movement. They provide information about the external forces involved in movement that can aid a coach or sports scientist to quantitatively evaluate the athlete's skill development. In this study, we develop our prototype of force plate with less than 100,- simply by using flexible force transducer attached inside rubber matt, in the form of square blocks (dimension: 250 mm × 150 mm × 10 mm), with maximum load up to 60 kg. The handmade force plate was tested by applying biomechanics analysis for standing and walking. The testing was done on Experimental Soccer Courses’ students at the Department of Physical Education, Health and Recreation, University of Cenderawasih. The design of the force plate system together with biomechanics analysis will be discussed.

High-resolution and large dynamic range nanomechanical mapping in tapping-mode atomic force microscopy

International Nuclear Information System (INIS)

Sahin, Ozgur; Erina, Natalia

2008-01-01

High spatial resolution imaging of material properties is an important task for the continued development of nanomaterials and studies of biological systems. Time-varying interaction forces between the vibrating tip and the sample in a tapping-mode atomic force microscope contain detailed information about the elastic, adhesive, and dissipative response of the sample. We report real-time measurement and analysis of the time-varying tip-sample interaction forces with recently introduced torsional harmonic cantilevers. With these measurements, high-resolution maps of elastic modulus, adhesion force, energy dissipation, and topography are generated simultaneously in a single scan. With peak tapping forces as low as 0.6 nN, we demonstrate measurements on blended polymers and self-assembled molecular architectures with feature sizes at 1, 10, and 500 nm. We also observed an elastic modulus measurement range of four orders of magnitude (1 MPa to 10 GPa) for a single cantilever under identical feedback conditions, which can be particularly useful for analyzing heterogeneous samples with largely different material components.

Installation of the MAXIMUM microscope at the ALS

International Nuclear Information System (INIS)

Ng, W.; Perera, R.C.C.; Underwood, J.H.; Singh, S.; Solak, H.; Cerrina, F.

1995-10-01

The MAXIMUM scanning x-ray microscope, developed at the Synchrotron Radiation Center (SRC) at the University of Wisconsin, Madison was implemented on the Advanced Light Source in August of 1995. The microscope's initial operation at SRC successfully demonstrated the use of multilayer coated Schwarzschild objective for focusing 130 eV x-rays to a spot size of better than 0.1 micron with an electron energy resolution of 250meV. The performance of the microscope was severely limited, because of the relatively low brightness of SRC, which limits the available flux at the focus of the microscope. The high brightness of the ALS is expected to increase the usable flux at the sample by a factor of 1,000. The authors will report on the installation of the microscope on bending magnet beamline 6.3.2 at the ALS and the initial measurement of optical performance on the new source, and preliminary experiments with surface chemistry of HF etched Si will be described

Image processing for HTS SQUID probe microscope

International Nuclear Information System (INIS)

Hayashi, T.; Koetitz, R.; Itozaki, H.; Ishikawa, T.; Kawabe, U.

2005-01-01

An HTS SQUID probe microscope has been developed using a high-permeability needle to enable high spatial resolution measurement of samples in air even at room temperature. Image processing techniques have also been developed to improve the magnetic field images obtained from the microscope. Artifacts in the data occur due to electromagnetic interference from electric power lines, line drift and flux trapping. The electromagnetic interference could successfully be removed by eliminating the noise peaks from the power spectrum of fast Fourier transforms of line scans of the image. The drift between lines was removed by interpolating the mean field value of each scan line. Artifacts in line scans occurring due to flux trapping or unexpected noise were removed by the detection of a sharp drift and interpolation using the line data of neighboring lines. Highly detailed magnetic field images were obtained from the HTS SQUID probe microscope by the application of these image processing techniques

Cryogenic immersion microscope

Science.gov (United States)

Le Gros, Mark; Larabell, Carolyn A.

2010-12-14

A cryogenic immersion microscope whose objective lens is at least partially in contact with a liquid reservoir of a cryogenic liquid, in which reservoir a sample of interest is immersed is disclosed. When the cryogenic liquid has an index of refraction that reduces refraction at interfaces between the lens and the sample, overall resolution and image quality are improved. A combination of an immersion microscope and x-ray microscope, suitable for imaging at cryogenic temperatures is also disclosed.

Casimir Force Between Quantum Plasmas

International Nuclear Information System (INIS)

Buenzli, P.

2005-01-01

Field fluctuations are responsible for an attractive force - the Casimir force - between two parallel (globally neutral) metallic plates separated by a distance d. At high temperature, or equivalently large d, this force is known to exhibit a classical and universal character (independent of the material constitution of the plates). In a recent work, we have displayed the microscopic mechanisms responsible for this universality within a classical model. The plates consist of slabs containing classical charged particles in fluid phase and thermal equilibrium (plasmas). The universality of the force proves to originate from screening sum rules satisfied by the charge correlations. Here we show how this result is altered when the quantum-mechanical nature of the particles is taken into account. It turns out that in addition to the classical result, the asymptotic force for large d comprises a non-universal quantum correction, which is, however, small at high temperature. The method relies on an exact representation of the charge correlations by quantum Mayer graphs, based on the Feynman-Kac path integral formalism. (author)

Modeling of contact theories for the manipulation of biological micro/nanoparticles in the form of circular crowned rollers based on the atomic force microscope

International Nuclear Information System (INIS)

Korayem, M. H.; Khaksar, H.; Taheri, M.

2013-01-01

This article has dealt with the development and modeling of various contact theories for biological nanoparticles shaped as cylinders and circular crowned rollers for application in the manipulation of different biological micro/nanoparticles based on Atomic Force Microscope. First, the effective contact forces were simulated, and their impact on contact mechanics simulation was investigated. In the next step, the Hertz contact model was simulated and compared for gold and DNA nanoparticles with the three types of spherical, cylindrical, and circular crowned roller type contact geometries. Then by reducing the length of the cylindrical section in the circular crowned roller geometry, the geometry of the body was made to approach that of a sphere, and the results were compared for DNA nanoparticles. To anticipatory validate the developed theories, the results of the cylindrical and the circular crowned roller contacts were compared with the results of the existing spherical contact simulations. Following the development of these contact models for the manipulation of various biological micro/nanoparticles, the cylindrical and the circular crowned roller type contact theories were modeled based on the theories of Lundberg, Dowson, Nikpur, Heoprich, and Hertz for the manipulation of biological micro/nanoparticles. Then, for a more accurate validation, the results obtained from the simulations were compared with those obtained by the finite element method and with the experimental results available in previous articles. The previous research works on the simulation of nanomanipulation have mainly investigated the contact theories used in the manipulation of spherical micro/nanoparticles. However since in real biomanipulation situations, biological micro/nanoparticles of more complex shapes need to be displaced in biological environments, this article therefore has modeled and compared, for the first time, different contact theories for use in the biomanipulation of

Note: A rigid piezo motor with large output force and an effective method to reduce sliding friction force.

Science.gov (United States)

Guo, Ying; Hou, Yubin; Lu, Qingyou

2014-05-01

We present a completely practical TunaDrive piezo motor. It consists of a central piezo stack sandwiched by two arm piezo stacks and two leg piezo stacks, respectively, which is then sandwiched and spring-clamped by a pair of parallel polished sapphire rods. It works by alternatively fast expanding and contracting the arm/leg stacks while slowly expanding/contracting the central stack simultaneously. The key point is that sufficiently fast expanding and contracting a limb stack can make its two sliding friction forces well cancel, resulting in the total sliding friction force is piezo motor's high compactness, precision, and output force make it perfect in building a high-quality harsh-condition (vibration resistant) atomic resolution scanning probe microscope.

Effect of honeybee stinger and its microstructured barbs on insertion and pull force.

Science.gov (United States)

Ling, Jintian; Song, Zhenhua; Wang, Jiarui; Chen, Keyun; Li, Jiyu; Xu, Shujia; Ren, Lei; Chen, Zhipeng; Jin, Dianwen; Jiang, Lelun

2017-04-01

Worker honeybee is well-known for its stinger with microscopic backward-facing barbs for self-defense. The natural geometry of the stinger enables painless penetration and adhesion in the human skin to deliver poison. In this study, Apis cerana worker honeybee stinger and acupuncture microneedle (as a barbless stinger) were characterized by Scanning Electron Microscope (SEM). The insertion and pull process of honeybee stinger into rabbit skin was performed by a self-developed mechanical loading equipment in comparison with acupuncture needle. In order to better understand the insertion and pull mechanisms of the stinger and its barbs in human multilayer skin, a nonlinear finite element method (FEM) was conducted. Experimental results showed that the average pull-out force of the stinger was 113.50mN and the average penetration force was only 5.75mN. The average penetration force of the stinger was about one order of magnitude smaller than that of an acupuncture microneedle while the average pull-out force was about 70 times larger than that of an acupuncture microneedle. FEM results showed that the stress concentrations were around the stinger tip and its barbs during the insertion process. The barbs were jammed in and torn the skin during the pull process. The insertion force of the stinger was greatly minimized due to its ultrasharp stinger tip and barbs while the pull force was seriously enhanced due to the mechanical interlocking of the barbs in the skin. These excellent properties are mainly a result of optimal geometry evolved by nature. Such finding may provide an inspiration for the further design of improved tissue adhesives and micro-needles for painless transdermal drug delivery and bio-signal recording. Copyright © 2017 Elsevier Ltd. All rights reserved.

Development of an Ultrafast Scanning Tunneling Microscope for Dynamic Surface Studies

National Research Council Canada - National Science Library

Nunes

1999-01-01

.... The microscope has demonstrated atomic resolution. We have a femtosecond laser system, optics for delivering ultrafast laser pulses to the STM, and a computer controlled delay line for time-resolved measurements...

Interface bonding in silicon oxide nanocontacts: interaction potentials and force measurements

Science.gov (United States)

Wierez-Kien, M.; Craciun, A. D.; Pinon, A. V.; Le Roux, S.; Gallani, J. L.; Rastei, M. V.

2018-04-01

The interface bonding between two silicon-oxide nanoscale surfaces has been studied as a function of atomic nature and size of contacting asperities. The binding forces obtained using various interaction potentials are compared with experimental force curves measured in vacuum with an atomic force microscope. In the limit of small nanocontacts (typically contact area which is altered by stretching speeds. The mean unbinding force is found to decrease as the contact spends time in the attractive regime. This contact weakening is featured by a negative aging coefficient which broadens and shifts the thermal-induced force distribution at low stretching speeds.

Energy profile of nanobody–GFP complex under force

International Nuclear Information System (INIS)

Klamecka, Kamila; Severin, Philip M; Milles, Lukas F; Gaub, Hermann E; Leonhardt, Heinrich

2015-01-01

Nanobodies (Nbs)—the smallest known fully functional and naturally occuring antigen-binding fragments—have attracted a lot of attention throughout the last two decades. Exploring their potential beyond the current use requires more detailed characterization of their binding forces as those cannot be directly derived from the binding affinities. Here we used atomic force microscope to measure rupture force of the Nb–green fluorescent protein (GFP) complex in various pulling geometries and derived the energy profile characterizing the interaction along the direction of the pulling force. We found that—despite identical epitopes—the Nb binds stronger (41–56 pN) to enhanced GFP than to wild-type GFP (28–45 pN). Measured forces make the Nb–GFP pair a potent reference for investigating molecular forces in living systems both in and ex vivo. (paper)

Quantum chromodynamics and the derivation of a microscopic theory of the nucleus

International Nuclear Information System (INIS)

Sliv, L.A.; Strikman, M.I.; Frankfurt, L.L.

1985-01-01

The progress which has already been made in the construction of a microscopic theory of the nucleus on the basis of quantum chromodynamics, the problems remaining, and the outlook for future progress are analyzed. The problem of nuclear forces, the role played by a high-momentum component in the nuclear wave function, and the role played by relativistic effects in various hard nuclear processes are discussed

Atomic force microscopic investigation of commercial pressure sensitive adhesives for forensic analysis.

Science.gov (United States)

Canetta, Elisabetta; Adya, Ashok K

2011-07-15

Pressure sensitive adhesive (PSA), such as those used in packaging and adhesive tapes, are very often encountered in forensic investigations. In criminal activities, packaging tapes may be used for sealing packets containing drugs, explosive devices, or questioned documents, while adhesive and electrical tapes are used occasionally in kidnapping cases. In this work, the potential of using atomic force microscopy (AFM) in both imaging and force mapping (FM) modes to derive additional analytical information from PSAs is demonstrated. AFM has been used to illustrate differences in the ultrastructural and nanomechanical properties of three visually distinguishable commercial PSAs to first test the feasibility of using this technique. Subsequently, AFM was used to detect nanoscopic differences between three visually indistinguishable PSAs. Copyright © 2011 Elsevier Ireland Ltd. All rights reserved.

Development of a Refined Space Vehicle Rollout Forcing Function

Science.gov (United States)

James, George; Tucker, Jon-Michael; Valle, Gerard; Grady, Robert; Schliesing, John; Fahling, James; Emory, Benjamin; Armand, Sasan

2016-01-01

For several decades, American manned spaceflight vehicles and the associated launch platforms have been transported from final assembly to the launch pad via a pre-launch phase called rollout. The rollout environment is rich with forced harmonics and higher order effects can be used for extracting structural dynamics information. To enable this utilization, processing tools are needed to move from measured and analytical data to dynamic metrics such as transfer functions, mode shapes, modal frequencies, and damping. This paper covers the range of systems and tests that are available to estimate rollout forcing functions for the Space Launch System (SLS). The specific information covered in this paper includes: the different definitions of rollout forcing functions; the operational and developmental data sets that are available; the suite of analytical processes that are currently in-place or in-development; and the plans and future work underway to solve two immediate problems related to rollout forcing functions. Problem 1 involves estimating enforced accelerations to drive finite element models for developing design requirements for the SLS class of launch vehicles. Problem 2 involves processing rollout measured data in near real time to understand structural dynamics properties of a specific vehicle and the class to which it belongs.

Microscope sterility during spine surgery.

Science.gov (United States)

Bible, Jesse E; O'Neill, Kevin R; Crosby, Colin G; Schoenecker, Jonathan G; McGirt, Matthew J; Devin, Clinton J

2012-04-01

Prospective study. Assess the contamination rates of sterile microscope drapes after spine surgery. The use of the operating microscope has become more prevalent in certain spine procedures, providing superior magnification, visualization, and illumination of the operative field. However, it may represent an additional source of bacterial contamination and increase the risk of developing a postoperative infection. This study included 25 surgical spine cases performed by a single spine surgeon that required the use of the operative microscope. Sterile culture swabs were used to obtain samples from 7 defined locations on the microscope drape after its use during the operation. The undraped technician's console was sampled in each case as a positive control, and an additional 25 microscope drapes were swabbed immediately after they were applied to the microscope to obtain negative controls. Swab samples were assessed for bacterial growth on 5% sheep blood Columbia agar plates using a semiquantitative technique. No growth was observed on any of the 25 negative control drapes. In contrast, 100% of preoperative and 96% of postoperative positive controls demonstrated obvious contamination. In the postoperative group, all 7 sites of evaluation were found to be contaminated with rates of 12% to 44%. Four of the 7 evaluated locations were found to have significant contamination rates compared with negative controls, including the shafts of the optic eyepieces on the main surgeon side (24%, P = 0.022), "forehead" portion on both the main surgeon (24%, P = 0.022) and assistant sides (28%, P = 0.010), and "overhead" portion of the drape (44%, P = 0.0002). Bacterial contamination of the operative microscope was found to be significant after spine surgery. Contamination was more common around the optic eyepieces, likely due to inadvertent touching of unsterile portions. Similarly, all regions above the eyepieces also have a propensity for contamination because of unknown contact

Development of a secondary electron energy analyzer for a transmission electron microscope.

Science.gov (United States)

Magara, Hideyuki; Tomita, Takeshi; Kondo, Yukihito; Sato, Takafumi; Akase, Zentaro; Shindo, Daisuke

2018-04-01

A secondary electron (SE) energy analyzer was developed for a transmission electron microscope. The analyzer comprises a microchannel plate (MCP) for detecting electrons, a coil for collecting SEs emitted from the specimen, a tube for reducing the number of backscattered electrons incident on the MCP, and a retarding mesh for selecting the energy of SEs incident on the MCP. The detection of the SEs associated with charging phenomena around a charged specimen was attempted by performing electron holography and SE spectroscopy using the energy analyzer. The results suggest that it is possible to obtain the energy spectra of SEs using the analyzer and the charging states of a specimen by electron holography simultaneously.

Light nuclei: an experimental proving ground for the microscopic cluster model

International Nuclear Information System (INIS)

Brown, R.E.

1978-01-01

A selected review is given of comparisons of experimental data for low-mass nuclear systems with results of calculations using microscopic cluster models. Stress is on the mass-4, -7, and -8 systems. Topics include influence of components of the nucleon-nucleon force, some consequences of the Pauli principle, effects of the Coulomb-exchange interaction, specific distortion, absorption in elastic scattering, and future needs and directions. Some as yet unpublished results are presented

TOPICAL REVIEW: Aspects of scanning force microscope probes and their effects on dimensional measurement

Science.gov (United States)

Yacoot, Andrew; Koenders, Ludger

2008-05-01

The review will describe the various scanning probe microscopy tips and cantilevers used today for scanning force microscopy and magnetic force microscopy. Work undertaken to quantify the properties of cantilevers and tips, e.g. shape and radius, is reviewed together with an overview of the various tip-sample interactions that affect dimensional measurements.

Theoretical investigation of the distance dependence of capillary and van der Waals forces in scanning force microscopy

International Nuclear Information System (INIS)

Stifter, Thomas; Marti, Othmar; Bhushan, Bharat

2000-01-01

The capillary and van der Waals forces between a tip and a plane in a scanning force microscope (SFM) are calculated. The forces are calculated for a fixed distance of tip and sample, as well as during retracting of the tip from the sample surface. The exact geometric shape of the meniscus is considered, with the boundary condition of fixed liquid volume during retraction. The starting volume is given by the operating and environmental conditions (surface tension, humidity, and tip geometry) at the point of lowest distance between tip and surface. The influence of the different parameters, namely, humidity, tip geometry, tip-sample starting distance, surface tension, and contact angles are studied. For each force curve also the geometric shape of the meniscus is calculated. The capillary forces are compared with van der Waals forces to understand their relative importance in various operating conditions. In addition to application in SFM, this analysis is useful in the design of surface roughness in microdevices for low adhesion in operating environments

Quantitative measurement of solvation shells using frequency modulated atomic force microscopy

Science.gov (United States)

Uchihashi, T.; Higgins, M.; Nakayama, Y.; Sader, J. E.; Jarvis, S. P.

2005-03-01

The nanoscale specificity of interaction measurements and additional imaging capability of the atomic force microscope make it an ideal technique for measuring solvation shells in a variety of liquids next to a range of materials. Unfortunately, the widespread use of atomic force microscopy for the measurement of solvation shells has been limited by uncertainties over the dimensions, composition and durability of the tip during the measurements, and problems associated with quantitative force calibration of the most sensitive dynamic measurement techniques. We address both these issues by the combined use of carbon nanotube high aspect ratio probes and quantifying the highly sensitive frequency modulation (FM) detection technique using a recently developed analytical method. Due to the excellent reproducibility of the measurement technique, additional information regarding solvation shell size as a function of proximity to the surface has been obtained for two very different liquids. Further, it has been possible to identify differences between chemical and geometrical effects in the chosen systems.

Compact scanning transmission x-ray microscope at the photon factory

International Nuclear Information System (INIS)

Takeichi, Yasuo; Inami, Nobuhito; Ono, Kanta; Suga, Hiroki; Takahashi, Yoshio

2016-01-01

We report the design and performance of a compact scanning transmission X-ray microscope developed at the Photon Factory. Piezo-driven linear stages are used as coarse stages of the microscope to realize excellent compactness, mobility, and vibrational and thermal stability. An X-ray beam with an intensity of ∼10 7 photons/s was focused to a diameter of ∼40 nm at the sample. At the soft X-ray undulator beamline used with the microscope, a wide range of photon energies (250–1600 eV) is available. The microscope has been used to research energy materials and in environmental sciences

The relationship between local liquid density and force applied on a tip of atomic force microscope: a theoretical analysis for simple liquids.

Science.gov (United States)

Amano, Ken-ichi; Suzuki, Kazuhiro; Fukuma, Takeshi; Takahashi, Ohgi; Onishi, Hiroshi

2013-12-14

The density of a liquid is not uniform when placed on a solid. The structured liquid pushes or pulls a probe employed in atomic force microscopy, as demonstrated in a number of experimental studies. In the present study, the relation between the force on a probe and the local density of a liquid is derived based on the statistical mechanics of simple liquids. When the probe is identical to a solvent molecule, the strength of the force is shown to be proportional to the vertical gradient of ln(ρDS) with the local liquid's density on a solid surface being ρDS. The intrinsic liquid's density on a solid is numerically calculated and compared with the density reconstructed from the force on a probe that is identical or not identical to the solvent molecule.

The relationship between local liquid density and force applied on a tip of atomic force microscope: A theoretical analysis for simple liquids

International Nuclear Information System (INIS)

Amano, Ken-ichi; Takahashi, Ohgi; Suzuki, Kazuhiro; Fukuma, Takeshi; Onishi, Hiroshi

2013-01-01

The density of a liquid is not uniform when placed on a solid. The structured liquid pushes or pulls a probe employed in atomic force microscopy, as demonstrated in a number of experimental studies. In the present study, the relation between the force on a probe and the local density of a liquid is derived based on the statistical mechanics of simple liquids. When the probe is identical to a solvent molecule, the strength of the force is shown to be proportional to the vertical gradient of ln(ρ DS ) with the local liquid's density on a solid surface being ρ DS . The intrinsic liquid's density on a solid is numerically calculated and compared with the density reconstructed from the force on a probe that is identical or not identical to the solvent molecule

Color Laser Microscope

Science.gov (United States)

Awamura, D.; Ode, T.; Yonezawa, M.

1987-04-01

A color laser microscope utilizing a new color laser imaging system has been developed for the visual inspection of semiconductors. The light source, produced by three lasers (Red; He-Ne, Green; Ar, Blue; He-Cd), is deflected horizontally by an AOD (Acoustic Optical Deflector) and vertically by a vibration mirror. The laser beam is focused in a small spot which is scanned over the sample at high speed. The light reflected back from the sample is reformed to contain linear information by returning to the original vibration mirror. The linear light is guided to the CCD image sensor where it is converted into a video signal. Individual CCD image sensors are used for each of the three R, G, or B color image signals. The confocal optical system with its laser light source yields a color TV monitor image with no flaring and a much sharper resolution than that of the conventional optical microscope. The AOD makes possible a high speed laser scan and a NTSC or PAL TV video signal is produced in real time without any video memory. Since the light source is composed of R, G, and B laser beams, color separation superior to that of white light illumination is achieved. Because of the photometric linearity of the image detector, the R, G, and B outputs of the system are most suitably used for hue analysis. The CCD linear image sensors in the optical system produce no geometrical distortion, and good color registration is available principally. The output signal can be used for high accuracy line width measuring. The many features of the color laser microscope make it ideally suited for the visual inspection of semiconductor processing. A number of these systems have already been installed in such a capacity. The Color Laser Microscope can also be a very useful tool for the fields of material engineering and biotechnology.

Casimir forces in multilayer magnetodielectrics with both gain and loss

DEFF Research Database (Denmark)

Amooghorban, Ehsan; Wubs, Martijn; Mortensen, N. Asger

2011-01-01

of the amplifying medium, with negative imaginary parts in finite frequency intervals, are identified and their relationships to microscopic coupling functions are determined. By carefully relating the two-point functions of the field theory to the optical Green functions, we calculate the Casimir energy...... and Casimir forces for a multilayer magnetodielectric medium with both gain and loss. We point out the essential differences with a purely passive layered medium. For a single layer, we find different bounds on the Casimir force for fully amplifying and for lossy media. The force is attractive in both cases...

Virtual reality microscope versus conventional microscope regarding time to diagnosis: an experimental study.

Science.gov (United States)

Randell, Rebecca; Ruddle, Roy A; Mello-Thoms, Claudia; Thomas, Rhys G; Quirke, Phil; Treanor, Darren