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Sample records for film thickness measurements

  1. Glue Film Thickness Measurements by Spectral Reflectance

    Energy Technology Data Exchange (ETDEWEB)

    B. R. Marshall

    2010-09-20

    Spectral reflectance was used to determine the thickness of thin glue layers in a study of the effect of the glue on radiance and reflectance measurements of shocked-tin substrates attached to lithium fluoride windows. Measurements based on profilometry of the components were found to be inaccurate due to flatness variations and deformation of the tin substrate under pressure during the gluing process. The accuracy of the spectral reflectance measurements were estimated to be ±0.5 μm, which was sufficient to demonstrate a convincing correlation between glue thickness and shock-generated light.

  2. Glue Film Thickness Measurements by Spectral Reflectance

    International Nuclear Information System (INIS)

    Marshall, B.R.

    2010-01-01

    Spectral reflectance was used to determine the thickness of thin glue layers in a study of the effect of the glue on radiance and reflectance measurements of shocked-tin substrates attached to lithium fluoride windows. Measurements based on profilometry of the components were found to be inaccurate due to flatness variations and deformation of the tin substrate under pressure during the gluing process. The accuracy of the spectral reflectance measurements were estimated to be ±0.5 (micro)m, which was sufficient to demonstrate a convincing correlation between glue thickness and shock-generated light.

  3. Optical methods for thickness measurements on thin metal films.

    Science.gov (United States)

    Pokrowsky, P

    1991-08-01

    The thickness and the dielectric constants of thin metal films on glass substrates are determined by two different methods. The first method is a combination of transmission and ellipsometer measurements (TELL method) and the second is based on attenuated total reflection (ATR method in the Kretschmann arrangement). For comparison, both methods are applied to gold films within a thickness range of 20-80 nm. Furthermore, the TELL method was applied to chromium films of thicknesses up to 150 nm. All experiments are done with a He-Ne laser at 633-nm wavelength.

  4. Imaging and thickness measurement of amorphous intergranular films using TEM

    International Nuclear Information System (INIS)

    MacLaren, I.

    2004-01-01

    Fresnel fringe analysis is shown to be unreliable for grain boundaries in yttrium-doped alumina: the determined thicknesses do not agree well with those measured from high resolution transmission electron microscopy (HRTEM), the asymmetry between under- and overfocus is very large, and Fresnel fringes are sometimes shown at boundaries which contain no amorphous film. An alternative approach to the analysis of HRTEM images of grain boundary films is demonstrated: Fourier filtering is used to remove the lattice fringes from the image thereby significantly enhancing the visibility of the intergranular films. The apparent film thickness shows a discrepancy between measurements from the original HRTEM image and the filtered image. It was shown that fringe delocalisation and diffuseness of the amorphous/crystalline interfaces will lead to a significant underestimate of the thickness in unprocessed HRTEM images. In contrast to this, the average thickness can be much more accurately measured from the Fourier-filtered image, provided the boundary is oriented accurately edge-on

  5. Measurement of thick film adhesion by an impact separation technique

    International Nuclear Information System (INIS)

    Snowden, W.E.; Aksay, I.A.

    1981-01-01

    The purpose of this study was to utilize a dynamic loading (impact separation) technique to determine absolute values for the force of adhesion required to separate a substrate/film interface into its two joining components. A principal advantage of the technique is that the force required for adhesive failure is applied directly at the interface by stress waves of relatively low amplitude, not by application of a force to the free surface of the film. Critical impact velocities required for separation of thick films from two types of substrates were measured. Values for force of adhesion were then calculated using a complex finite-difference computer code developed for analysis of a variety of dynamic problems

  6. Parched elasto hydrodynamic lubrication film thickness measurement in an instrument ball bearing

    Science.gov (United States)

    Kingsbury, E.; Schritz, B.; Prahl, J.

    1988-01-01

    Parched Elasto Hydrodynamic Lubricant (PEHL) film thickness in a large instrument ball bearing is measured by electrical capacitance across its ball set. Correlation is shown between changes in film thickness and changes in Basic Speed Ratio (BSR) measured at the same time. BSR is confirmed as a sensitive, non-intrusive measure of transients in film thickness in a real bearing.

  7. Thick Films acoustic sensors devoted to MTR environment measurements. Thick Films acoustic sensors devoted to Material Testing Reactor environment measurements

    International Nuclear Information System (INIS)

    Very, F.; Rosenkrantz, E.; Combette, P.; Ferrandis, J.Y.; Fourmentel, D.; Destouches, C.; Villard, J.F.

    2015-01-01

    The development of advanced instrumentation for in-pile experiments in Material Testing Reactor constitutes a main goal for the improvement of the nuclear fuel behavior knowledge. An acoustic method for fission gas release detection was tested with success during a first experiment called REMORA 3 in 2010 and 2011, and the results were used to differentiate helium and fission gas release kinetics under transient operating conditions. This experiment was lead at OSIRIS reactor (CEA Saclay, France). The maximal temperature on the sensor during the irradiation was about 150 deg. C. In this paper we present a thick film transducer produce by screen printing process. The screen printing of piezoelectric offers a wide range of possible applications for the development of acoustic sensors and piezoelectric structure for measurements in high temperature environment. We firstly produced a Lead Zirconate Titanate (PZT) based paste composed of Pz27 powder from Ferroperm, CF7575 glass, and organic solvent ESL 400. Likewise a Bismuth Titanate based paste synthesized in our laboratory was produced. With these inks we produced thick film up to 130 μm by screen printing process. Material properties characterizations of these thick-film resonators are essential for device design and applications. The piezoelectric coefficients d33 and pyro-electric P(T) coefficient are investigated. The highest P(T) and d33 are respectively 80 μC.m -2 .K -1 and 130 μC.N -1 for the PZT transducer -which validates the fabrication process-. In view of the development of this transducer oriented for high temperature and irradiation environment, we investigated the electrical properties of the transducers for different ranges of frequencies and temperature - from 20 Hz up to 40 MHz between 30 and 400 deg. C. We highlight the evolution of the impedance response and piezoelectric parameters of screen printed piezoelectric structures on alumina. Shortly an irradiation will be realized in order to

  8. Thick Films acoustic sensors devoted to MTR environment measurements. Thick Films acoustic sensors devoted to Material Testing Reactor environment measurements

    Energy Technology Data Exchange (ETDEWEB)

    Very, F.; Rosenkrantz, E.; Combette, P.; Ferrandis, J.Y. [University Montpellier, IES, UMR 5214, F-34000, Montpellier (France); CNRS, IES, UMR 5214, F-34000, Montpellier (France); Fourmentel, D.; Destouches, C.; Villard, J.F. [CEA, DEN, Instrumentation Sensors and Dosimetry Laboratory, Cadarache, F-13108 St Paul lez Durance (France)

    2015-07-01

    The development of advanced instrumentation for in-pile experiments in Material Testing Reactor constitutes a main goal for the improvement of the nuclear fuel behavior knowledge. An acoustic method for fission gas release detection was tested with success during a first experiment called REMORA 3 in 2010 and 2011, and the results were used to differentiate helium and fission gas release kinetics under transient operating conditions. This experiment was lead at OSIRIS reactor (CEA Saclay, France). The maximal temperature on the sensor during the irradiation was about 150 deg. C. In this paper we present a thick film transducer produce by screen printing process. The screen printing of piezoelectric offers a wide range of possible applications for the development of acoustic sensors and piezoelectric structure for measurements in high temperature environment. We firstly produced a Lead Zirconate Titanate (PZT) based paste composed of Pz27 powder from Ferroperm, CF7575 glass, and organic solvent ESL 400. Likewise a Bismuth Titanate based paste synthesized in our laboratory was produced. With these inks we produced thick film up to 130 μm by screen printing process. Material properties characterizations of these thick-film resonators are essential for device design and applications. The piezoelectric coefficients d33 and pyro-electric P(T) coefficient are investigated. The highest P(T) and d33 are respectively 80 μC.m{sup -2}.K{sup -1} and 130 μC.N{sup -1} for the PZT transducer -which validates the fabrication process-. In view of the development of this transducer oriented for high temperature and irradiation environment, we investigated the electrical properties of the transducers for different ranges of frequencies and temperature - from 20 Hz up to 40 MHz between 30 and 400 deg. C. We highlight the evolution of the impedance response and piezoelectric parameters of screen printed piezoelectric structures on alumina. Shortly an irradiation will be realized in

  9. A new attempt of measurement film thickness by x-ray diffractometry

    International Nuclear Information System (INIS)

    Kosaka, Masao; Kobayashi, Hideo

    1987-01-01

    In order to make film thickness measurements independent from the property or the structure of the film materials or the substrate, it is needed to adopt instead of directly utilizing the X-ray diffraction intensity, or attenuation information obtained from the substrate or film material, other new methods for measurement. Among the information obtained by X-ray diffraction, if intensity is excluded, others are F.W.H.M. and diffraction angle, only. If it is possible to investigate the film thickness dependency of the diffraction angle, it should be possible to measure the film thickness by diffraction angle. However, since diffraction angle has no film thickness dependency, it cannot be used directly for measurement. However, if we consider the principle of the X-ray diffractometer method, although it may be very slight, the substrate will be eccentric from the revolving center of the goniometer on account of the thickness of the film. If eccentricity occurs, this will cause changes in the diffraction angle. If we set the radius of the goniometer as R, diffraction angle θ, and the eccentricity from the revolving center of the specimen surface X, the deflection angle Δ2θ of 2θ may be expressed by Δ2θ = -2X · COSθ/R Thus, if X is caused by the film thickness, and by measuring the Δ2θ, it will be possible to measure the film thickness. As a result of the experiment, it was found that X-ray diffraction method can be used for the measurement of the film thickness of a few microns or above by utilizing the eccentricity caused by the film thickness. Especially it has the advantage of being able to measure thick films that X-rays will not penetrate, without being influenced by the chemical structure of the film or the substrates. (author)

  10. Elastohydrodynamic film thickness formula based on X-ray measurements with a synthetic paraffinic oil

    Science.gov (United States)

    Loewenthal, S. H.; Parker, R. J.; Zaretsky, E. V.

    1973-01-01

    An empirical elastohydrodynamic film thickness formula for heavily loaded contacts based upon X-ray film thickness measurements made with a synthetic paraffinic oil is presented. The deduced relation was found to adequately reflect the high load dependence exhibited by the measured minimum film thickness data at high Hertizian contact stresses, that is, above 1.04 x 10 to the ninth N/sq m (150,000 psi). Comparisons were made with the numerical results from a theoretical isothermal film thickness formula. The effects of changes in contact geometry, material, and lubricant properties on the form of the empirical model are also discussed.

  11. Online terahertz thickness measurement in films and coatings

    Science.gov (United States)

    Duling, Irl N.; White, Jeffrey S.

    2017-02-01

    Pulsed terahertz systems are currently being deployed for online process control and quality control of multi-layered products for use in the building products and aerospace industries. While many laboratory applications of terahertz can allow waveforms to be acquired at rates of 1 - 40 Hz, online applications require measurement rates of in excess of 100Hz. The existing technologies of thickness measurement (nuclear, x-ray, or laser gauges) have rates between 100 and 1000 Hz. At these rates, the single waveform bandwidth must still remain at 2THz or above to allow thinner layers to be measured. In the applications where terahertz can provide unique capability (e.g. multi-layer thickness, delamination, density) long-term stability must be guaranteed within the tolerance required by the measurement. This can mean multi-day stability of less than a micron. The software that runs on these systems must be flexible enough to allow multiple product configurations, while maintaining the simplicity required by plant operators. The final requirement is to have systems that can withstand the environmental conditions of the measurement. This might mean qualification in explosive environments, or operation in hot, wet or dusty environments. All of these requirements can put restrictions on not only the voltage of electronic circuitry used, but also the wavelength and optical power used for the transmitter and receiver. The application of terahertz systems to online process control presents unique challenges that not only effect the physical design of the system, but can also effect the choices made on the terahertz technology itself.

  12. Measurement of central corneal thickness and pre-corneal tear film thickness of rabbits using the Scheimpflug system

    Directory of Open Access Journals (Sweden)

    Jing Dong

    2013-10-01

    Full Text Available AIM:To measure central corneal thickness (CCT and pre-corneal tear film thickness using the Galilei dual-Scheimpflug analyzer (GSA in New Zealand white rabbits.METHODS:Ten normal New Zealand white rabbits (20 eyes were included in this study. With the assistance of 0.1% fluorescein, the pre-corneal tear film can be well visualized. Both eyes of each rabbit were scanned once with the GSA pre- and post-instillation of 1μL 0.1% fluorescein. The difference between the two measurements of CCT (4-mm diameter was recorded as the pachymetric values of the central tear film.RESULTS:The CCT of pre- and post-instillation was 388.8±9.5μm and 407.0±10.5μm, respectively. After a paired t-test analysis, the central pre-corneal tear film thickness of 4mm diameter was 18.2±5.31μm with a 95% confidence interval of (15.7, 20.6μm (PCONCLUSION:GSA can be used to measure CCT and analyze central tear film thickness of rabbits with the help of fluorescein.

  13. Characterization of the flooding in vertical tubes by means of the film thickness measurement

    International Nuclear Information System (INIS)

    Malandrone, M.; Mioliggi, L.; Panella, B.; Scorta, G.

    1992-01-01

    The air-water countercurrent flow up to the flooding transition in a vertical tube has been experimentally investigated by liquid film thickness measurement performed by means of an electrical two-wires conductance probe. The liquid film mean thickness, the probability density function, the spectral power density and the power of the signal have been derived for a wide range of air and water flow rate, and related to the flow pattern with particular attention to the flooding phenomena. (6 figures) (Author)

  14. Study of thin film thickness measurement based on white light interference

    Science.gov (United States)

    Zheng, Yuanbo; Chu, Chunxiao; Wang, Xia

    2017-02-01

    One method for measuring thin film thickness was proposed in this paper, which based on white light interference. One parallel flat crystal was used to be the standard glass, and put another glass on it, to form one air wedge between them. The reflectance spectrum of two beams interference was measured by one spectrometer. By fitting the reflectance spectrum, wave numbers corresponding to every peak can be found, then using two beam interference theory, the air gap thickness at light incident point can be fitted. By measuring the air gap thickness at different positions, the flatness of measured surface also can be analyzed.

  15. Development of an in-line X-ray reflectivity technique for metal film thickness measurement

    International Nuclear Information System (INIS)

    Windover, D.; Barnet, E.; Summers, J.; Gribbin, C.; Lu, T.-M.; Kumar, A.; Bakhru, H.; Lee, S.L.

    2001-01-01

    Non-destructive measurement of thin film (particularly metal film) thickness less than 10 nm has been a challenging task. In this work, we showed that it is possible to obtain the thickness of ultra-thin tantalum films within seconds using a fixed-angle, energy dispersive X-ray reflectivity technique by a conventional, low-energy X-ray copper or chromium source (20 kV/20 mA/400W) and using Parratt reflectivity modeling. We compared this fixed angle, energy dispersive result with more conventional fixed energy, angular dispersive reflectivity to establish the validity of the method and provide error estimates for fast thickness modeling. This X-ray technique is particularly useful for very thin diffusion barrier measurements in future microelectronics applications

  16. Measurements of liquid film thickness, concentration, and temperature of aqueous urea solution by NIR absorption spectroscopy

    Science.gov (United States)

    Pan, R.; Jeffries, J. B.; Dreier, T.; Schulz, C.

    2016-01-01

    A multi-wavelength near-infrared (NIR) diode laser absorption sensor has been developed and demonstrated for real-time monitoring of the thickness, solute concentration, and temperature of thin films of urea-water solutions. The sensor monitors the transmittance of three near-infrared diode lasers through the thin liquid film. Film thickness, urea mass fraction, and liquid temperature were determined from measured transmittance ratios of suitable combinations of lasers. Available laser wavelengths were selected depending on the variation of the NIR absorption spectrum of the solution with temperature and solute concentration. The spectral database was measured by a Fourier transform infrared spectrometer in the range 5500-8000 cm-1 for urea solutions between 5 and 40 wt% and temperatures between 298 and 338 K. A prototype sensor was constructed, and the sensor concept was first validated with measurements using a calibration cell providing liquid layers of variable thickness (200-1500 µm), urea mass fraction (5-40 wt%) and temperature (298-318 K). Temporal variations of film thickness and urea concentration were captured during the constant-temperature evaporation of a liquid film deposited on an optically polished heated quartz flat.

  17. Diode laser-based standoff absorption measurement of water film thickness in retro-reflection

    Science.gov (United States)

    Pan, R.; Brocksieper, C.; Jeffries, J. B.; Dreier, T.; Schulz, C.

    2016-09-01

    A dual-wavelength diode laser-based absorption sensor for standoff point measurements of water film thickness on an opaque surface is presented. The sensor consists of a diode laser source, a foil as backscattering target, and off-axis paraboloids for collecting the fraction of the laser radiation transmitted through the liquid layer via retro-reflection. Laser wavelengths in the near infrared at 1412 and 1353 nm are used where the temperature dependence of the liquid water absorption cross section is known. The lasers are fiber coupled and the detection of the retro-reflected light was accomplished through a multimode fiber and a single photodiode using time-division multiplexing. The water film thickness at a given temperature was determined from measured transmittance ratios at the two laser wavelengths. The sensor concept was first validated with measurement using a temperature-controlled calibration cell providing liquid layers of variable and known thickness between 100 and 1000 µm. Subsequently, the sensor was demonstrated successfully during recording the time-varying thickness of evaporating water films at fixed temperatures. The film thickness was recorded as a function of time at three temperatures down to 50 µm.

  18. Nondestructive measurement of homoepitaxially grown GaN film thickness with Fourier transform infrared spectroscopy

    Science.gov (United States)

    Horikiri, Fumimasa; Narita, Yoshinobu; Yoshida, Takehiro

    2017-12-01

    In vertical devices containing GaN homoepitaxial layers on GaN substrates, the layer thickness is a key parameter that needs to be clarified before starting the device process. We applied Fourier transform infrared spectroscopy (FT-IR) to a homoepitaxially grown GaN film that consisted of an n--GaN layer. The estimated film thickness from the FT-IR spectrum agreed well with the results of cross-sectional scanning electron microscope cathodoluminescence images. This is the first report of nondestructive film thickness measurements for homoepitaxially grown GaN and indicates the applicability of FT-IR to the nondestructive inspection of vertical GaN power devices.

  19. Thin-film thickness measurement using x-ray peak ratioing in the scanning electron microscope

    International Nuclear Information System (INIS)

    Elliott, N.E.; Anderson, W.E.; Archuleta, T.A.; Stupin, D.M.

    1981-01-01

    The procedure used to measure laser target film thickness using a scanning electron microscope is summarized. This method is generally applicable to any coating on any substrate as long as the electron energy is sufficient to penetrate the coating and the substrate produces an x-ray signal which can pass back through the coating and be detected

  20. Novel method for the measurement of liquid film thickness during fuel spray impingement on surfaces.

    Science.gov (United States)

    Henkel, S; Beyrau, F; Hardalupas, Y; Taylor, A M K P

    2016-02-08

    This paper describes the development and application of a novel optical technique for the measurement of liquid film thickness formed on surfaces during the impingement of automotive fuel sprays. The technique makes use of the change of the light scattering characteristics of a metal surface with known roughness, when liquid is deposited. Important advantages of the technique over previously established methods are the ability to measure the time-dependent spatial distribution of the liquid film without a need to add a fluorescent tracer to the liquid, while the measurement principle is not influenced by changes of the pressure and temperature of the liquid or the surrounding gas phase. Also, there is no need for non-fluorescing surrogate fuels. However, an in situ calibration of the dependence of signal intensity on liquid film thickness is required. The developed method can be applied to measure the time-dependent and two-dimensional distribution of the liquid fuel film thickness on the piston or the liner of gasoline direct injection (GDI) engines. The applicability of this technique was evaluated with impinging sprays of several linear alkanes and alcohols with different thermo-physical properties. The surface temperature of the impingement plate was controlled to simulate the range of piston surface temperatures inside a GDI engine. Two sets of liquid film thickness measurements were obtained. During the first set, the surface temperature of the plate was kept constant, while the spray of different fuels interacted with the surface. In the second set, the plate temperature was adjusted to match the boiling temperature of each fuel. In this way, the influence of the surface temperature on the liquid film created by the spray of different fuels and their evaporation characteristics could be demonstrated.

  1. Laser-based diagnostics for the measurement of liquid water film thickness.

    Science.gov (United States)

    Greszik, Daniel; Yang, Huinan; Dreier, Thomas; Schulz, Christof

    2011-02-01

    Three different diagnostic techniques are investigated for measurement of the thickness of liquid water films deposited on a transparent quartz plate. The methods are based on laser-induced fluorescence (LIF) from low concentrations of a dissolved tracer substance and spontaneous Raman scattering of liquid water, respectively, both excited with 266 nm of radiation, and diode laser absorption spectroscopy (DLAS) in the near-infrared spectral region. Signal intensities are calibrated using liquid layers of known thickness between 0 and 1000 μm. When applied to evaporating liquid water films, the thickness values derived from the direct DLAS and Raman scattering measurements correlate well with each other as a function of time after the start of data recording, while the LIF signal derived thickness values decrease faster with time due to selective tracer evaporation from the liquid. The simultaneous application of the LIF with a tracer-free detection technique can serve as an in situ reference for quantitative film thickness measurements.

  2. A reliable control system for measurement on film thickness in copper chemical mechanical planarization system

    Science.gov (United States)

    Li, Hongkai; Qu, Zilian; Zhao, Qian; Tian, Fangxin; Zhao, Dewen; Meng, Yonggang; Lu, Xinchun

    2013-12-01

    In recent years, a variety of film thickness measurement techniques for copper chemical mechanical planarization (CMP) are subsequently proposed. In this paper, the eddy-current technique is used. In the control system of the CMP tool developed in the State Key Laboratory of Tribology, there are in situ module and off-line module for measurement subsystem. The in situ module can get the thickness of copper film on wafer surface in real time, and accurately judge when the CMP process should stop. This is called end-point detection. The off-line module is used for multi-points measurement after CMP process, in order to know the thickness of remained copper film. The whole control system is structured with two levels, and the physical connection between the upper and the lower is achieved by the industrial Ethernet. The process flow includes calibration and measurement, and there are different algorithms for two modules. In the process of software development, C++ is chosen as the programming language, in combination with Qt OpenSource to design two modules' GUI and OPC technology to implement the communication between the two levels. In addition, the drawing function is developed relying on Matlab, enriching the software functions of the off-line module. The result shows that the control system is running stably after repeated tests and practical operations for a long time.

  3. Dynamic measurement of liquid film thickness in stratified flow by using ultrasonic echo technique

    International Nuclear Information System (INIS)

    Serizawa, A.; Nagane, K.; Kamei, T.; Kawara, Z.; Ebisu, T.; Torikoshi, K.

    2004-01-01

    We developed a technique to measure time-dependent local film thickness in stratified air-water flow over a horizontal plate by using a time of flight of ultrasonic transmission. The ultrasonic echoes reflected at the liquid/air interfaces are detected by a conventional ultrasonic instrumentation, and the signals are analyzed by a personal computer after being digitalized by an A/D converter to give the time of flight for the ultrasonic waves to run over a distance of twice of the film thickness. A 3.8 mm diameter probe type ultrasonic transducer was used in the present work which transmits and receives 10 MHz frequency ultrasonic waves. The estimated spatial resolution with this arrangement is 0.075 mm in film thickness for water. The time resolution, which depends on both the A/D converter and the memory capacity was up to several tens Hz. We also discussed the sensitivity of the method to the inclination angle of the interfaces. (author)

  4. Measurement of thickness of thin films by the X-ray diffraction method

    International Nuclear Information System (INIS)

    Srinivasan, C.; Balasingh, C.; Singh, A.K.

    1979-07-01

    X-ray diffraction method can be used to measure the thickness of thin films (coatings). The principle and the experimental details of the x-ray diffraction methods are described. The intensities of the diffracted beams are derived assuming a random orientation of the crystallites in the diffracting medium. Consequently, the expressions are not valid when the sample has preferred orientation. To check the performance of the method, thicknesses of nickel deposits on mild steel plates were determined by the x-ray diffraction method and the results compared with those obtained by the weighing method and metallographic examination. The weighing method which gives an accuracy of +- 0.1 micron is taken as the standard. The x-ray diffraction methods and the metallographic examinations give values within +- 1 micron of the value obtained by the weighing method. (author)

  5. Design of instantaneous liquid film thickness measurement system for conductive or non-conductive fluid with high viscosity

    Directory of Open Access Journals (Sweden)

    Yongxin Yu

    2017-06-01

    Full Text Available In the paper, a new capacitive sensor with a dielectric film coating was designed to measure the thickness of the liquid film on a flat surface. The measured medium can be conductive or non-conductive fluid with high viscosity such as silicone oil, syrup, CMC solution and melt. With the dielectric film coating, the defects caused by the humidity in a capacitor can be avoided completely. With a excitation frequency 0-20kHz, the static permittivity of capacitive sensor is obtained and stable when small thicknesses are monitored within the frequency of 0-3kHz. Based on the measurement principle, an experimental system was designed and verified including calibration and actual measurement for different liquid film thickness. Experimental results showed that the sensitivity, the resolution, repeatability and linear range of the capacitive sensor are satisfied to the liquid film thickness measurement. Finally, the capacitive measuring system was successfully applied to the water, silicone oil and syrup film thickness measurement.

  6. Thickness measurement of aluminum, titanium, titanium silicide, and tungsten silicide films by x-ray fluorescence

    International Nuclear Information System (INIS)

    Ernst, S.; Lee, C.O.; Lee, J.J.

    1988-01-01

    X-ray fluorescence (XRF) has received a great deal of attention in the last few years as a quantitative means of determining both the stoichiometry and thickness of many different kinds of films. Examples include Ag and Cu films on mica substrates, Sn-Pb alloys on steel substrates, Al-Ti multilayers on Cu substrates and oxide films on silicon substrates. In XRF the sample is irradiated with x-rays which in turn cause x-rays to be given off by the sample. These x-rays that are given off by the sample can then be analyzed both for energy and intensity. The energy of the x-rays is characteristic of the elemental makeup of the sample and the intensity of the x-rays is dependent on how much of the particular element is present. The intensity then can be related to the thickness of a film if the stoichiometry of the film can be assumed constant. With the increased interest in silicides and more recently, the self-aligned silicide (salicide) process (8-10) for VLSI applications, in-line process monitoring of silicide film thickness has become important to integrated circuit manufacturing. In this study, the number of x-ray photons given of by Al, Ti, titanium silicide, and tungsten silicide films on silicon-based substrates was quantified so that a film thickness for an unknown sample could then be determined easily. In addition, XRF is a more accurate technique, limited principally by the accuracy technique, limited principally by the accuracy of the reference used and the amount of time the x-ray photons are counted

  7. Measurement of liquid film thickness in air - water two phase flows in conventional and mini channels using image processing

    Energy Technology Data Exchange (ETDEWEB)

    Seshadri, Arunkumar; Mahadevan, Swetha; Muniyandi, Venkatesan [SASTRA University, Thanjavur (India)

    2015-05-15

    The measurement and study of liquid films in the case of two phase flows is significant in many heat transfer and mass transfer applications, such as chemical process industries, micro reactors, coating processes and in boilers. The focus of the present study was to measure and characterize the thickness of the liquid films for various two phase flow regimes in conventional and in mini channels using a non-intrusive technique. Experiments were performed on tubes of diameters 0.6, 1.5, 2.6 and 3.4mm. The superficial velocities of gas and liquid are in the range of 0.01-50 and 0.01-3m/s, respectively. The flow patterns were recorded with a high speed camera. A method to determine the two phase flow velocity using image registration has been discussed. Morphological processing and gray scale analysis were used to determine the liquid film thickness and characterize the flow regimes. The flow patterns identified are bubbly, dispersed bubbly, slug, slug-annular, wavy-annular, stratified, and annular. The flow regimes were validated with flow maps available in the literature. The liquid film thickness was identified by distance transform technique in image processing. The magnitude of film thickness varied with liquid and gas flow velocities. The film thickness was represented in terms of capillary number. The variation in film thickness along the length of the flow regime has been discussed. A relation between the liquid film thicknesses measured using the non-intrusive image processing technique and capillary number for the conventional and mini tubes is proposed based on the analysis. h/d=2.03Ca{sup 0.13}We{sup 0.52} for Bo>1 h/d=1.08Ca{sup 0.4}We{sup 0.35} for Bo<1 It is concluded from the proposed correlation that the variation in liquid film thickness is different for conventional and mini channels because of the effect of inertial dominance in conventional channels and viscous dominance in mini channels.

  8. Film thickness determination by grazing incidence diffraction

    Energy Technology Data Exchange (ETDEWEB)

    Battiston, G. A.; Gerbasi, R. [CNR, Padua (Italy). Istituto di Chimica e Tecnologie Inorganiche e dei Materiali Avanzati

    1996-09-01

    Thin films deposited via MOCVD (Metal Organic Chemical Vapour Deposition) are layers in the thickness range of a few manometers to about ten micrometers. An understanding of the physics and chemistry of films is necessary for a better comprehension of the phenomena involved in the film deposition procedure and its optimisation. Together with the crystalline phase a parameter that must be determined is the thickness of the layer. In this work the authors present a method for the measurement of the film thickness. This procedure, based on diffraction intensity absorption of the X-rays, both incident and diffracted in passing through the layers, resulted quite simple, rapid and non-destructive.

  9. Measurement of oil film thickness and friction force on a guide shoe bearing

    DEFF Research Database (Denmark)

    Vølund, Anders

    2002-01-01

    An experimental program was carried out in order to reveal oil film thickness, and friction force of the guide shoe bearing of a large two stroke marine diesel engine. The experiment was conducted on a full size engine located at the research facility at MAN B&W Diesel A/S. The experiment...... was conducted such that the influence from the experiment on the characteristics were as small as possible. The objective of the experiment was to determine the frictional loss of this bearing and to check whether a suggested numerical model was applicable or not. Some future aspects for this bearing...

  10. In situ measurement of humidity induced changes in the refractive index and thickness of polyethylene glycol thin films

    Science.gov (United States)

    Bilen, Bukem; Skarlatos, Yani; Aktas, Gulen; Inci, M. Naci; Dispinar, Tugba; Kose, M. Merve; Sanyal, Amitav

    2008-11-01

    Humidity induced changes in the refractive index and thickness of polyethylene glycol (PEG) thin films are in situ determined by optical waveguide spectroscopy. PEG brushes are covalently attached to the surface of a thin gold film on a borosilicate crown glass (BK7) using a grafting-from chemical synthesis technique. The measurements are carried out in an attenuated total internal reflection setup. At low humidity levels, both the refractive index and the thickness change gradually due to swelling of the PEG thin films upon water intake. At around 80% relative humidity, a steep decrease in the refractive index and a steep increase in the thickness are observed as a result of a phase change from a semicrystalline state to a physical gel state. The hydrogenation of PEG films causes a less pronounced phase change from a semicrystalline state to a gel state. Due to fewer ether oxygen atoms available for the water molecules to make hydrogen bonding, the polymer has a more stable structure than before and the phase change is observed to shift to higher humidity levels. It is discussed that such a humidity induced change in the index of refraction can be utilized in constructing of a PEG based humidity sensor.

  11. Wet/dry film thickness measurement of paint by absorption spectroscopy with acousto-optic tunable filter spectrometer

    Science.gov (United States)

    Sinha, Pranay G.; Xiong, Xiangchun; Jin, Feng; Trivedi, Sudhir; Prasad, Narashima S.

    2005-08-01

    Controlling/monitoring the thickness of applied paint in real time is important to many situations including painting ship and submarine hulls in dry docks for maintaining health of ships and submarines against the harshness of the sea, in automobile and aerospace industries, and in a variety of other industries as a control sensor that plays significant role in product quality, process control, and cost control. Insufficient thickness results to inadequate protection while overspray leads to waste and pollution of the environment. A rugged instrumentation for the real time non-contact accurate measurement of wet and dry paint film thickness measurement will be immensely valuable. As paint is applied with several layers of the same or different type, thickness of each newly sprayed wet layer is of most interest, but measurement on dry paint is also useful. In this study, we use acousto-optic tunable filter-based near infrared spectrometer to obtain the absorption spectrum of layers of paint sprayed on sand blasted steel surface and thus measure the thickness of coating under both wet and dry situations. NIR spectra are obtained from 1100 to 2300 nm on four sample of different thickness of paint up to 127 micron. Partial least squares model built with the spectra shows good correlation with standard error of prediction within ~ 0.7 micron. Results indicate that the spectra also respond to the amount of organic solvent in the wet paint and can be used to monitor the degree of dryness of the paint in real time.

  12. Thickness measurement of soft thin films on periodically patterned magnetic substrates by phase difference magnetic force microscopy.

    Science.gov (United States)

    Passeri, D; Dong, C; Angeloni, L; Pantanella, F; Natalizi, T; Berlutti, F; Marianecci, C; Ciccarello, F; Rossi, M

    2014-01-01

    The need for accurate measurement of the thickness of soft thin films is continuously encouraging the development of techniques suitable for this purpose. We propose a method through which the thickness of the film is deduced from the quantitative measurement of the contrast in the phase images of the sample surface acquired by magnetic force microscopy, provided that the film is deposited on a periodically patterned magnetic substrate. The technique is demonstrated by means of magnetic substrates obtained from standard floppy disks. Colonies of Staphylococcus aureus adherent to such substrates were used to obtain soft layers with limited lateral (a few microns) and vertical (hundreds of nanometers) size. The technique is described and its specific merits, limitations and potentialities in terms of accuracy and measurable thickness range are discussed. These parameters depend on the characteristics of the sensing tip/cantilever as well as of the substrates, the latter in terms of spatial period and homogeneity of the magnetic domains. In particular, with the substrates used in this work we evaluated an uncertainty of about 10%, a limit of detection of 50-100 nm and an upper detection limit (maximum measurable thickness) of 1 μm, all obtained with standard lift height values (50-100 nm). Nonetheless, these parameters can be easily optimized by selecting/realizing substrates with suitable spacing and homogeneity of the magnetic domains. For example, the upper detection limit can be increased up to 25-50 μm while the limit of detection can be reduced to a few tens of nanometers or a few nanometers. © 2013 Elsevier B.V. All rights reserved.

  13. In vivo sweat film layer thickness measured with Fourier-domain optical coherence tomography

    CSIR Research Space (South Africa)

    Jonathan, E

    2008-01-01

    Full Text Available s Centre form the f th s pr t fi d id Keywords: Fourier-domain optical coherence tomography; Human sweat secretion; Sweat gland; Sweat duct; Hyperhidrosis growing list of triggers include cancer, glucose control disorder, mental stress, social..., that is, the gland, duct and pore(s). However, due to a slow imaging time, COCT is largely restricted to morphometry of human tissue and thickness measurement of biologic and biologic samples [12,13]. ARTICLE IN PRESS Fourier-domain optical coherence...

  14. Laser-induced fluorescence measurement of the oil film thickness in an internal combustion engine

    Science.gov (United States)

    Ostroski, Greg M.; Ghandhi, Jaal B.

    1997-11-01

    The use of a fluorescent dopant molecule to enhance the natural fluorescence of motor oils, and allow quantitative determination of temperature and film thickens in internal combustion engines has been investigated. Measurement of the fluorescence as a function of temperature were made with neat Mobil 1, and solutions of the dopant BTBP in mineral oil and Mobil 1. The fluorescence yield of neat Mobil 1 was found to vary by 30 percent over the temperature range explored, but the spectral characteristics, as measured with bandpass filters, were unaffected by temperature. The BTBP fluorescence was found to increase significantly with temperature, and it was found the narrower regions in the spectrum increased proportionally more than the fluorescence collected over the entire spectrum, allowing a determination of temperature to be made which can then be used to correct for the change in fluorescence yield. Solutions in Mobil 1 showed a smaller increase than that observed in mineral oil.

  15. Determination of optical dispersion and film thickness of semiconducting disordered layers by transmission measurements: Application for chemically vapor deposited Si and SnO2 film

    Science.gov (United States)

    Davazoglou, D.

    1997-01-01

    A method is presented for the determination of the optical dispersion and thickness of thin semiconducting disordered layers, or stacks of such layers, deposited on fully or partly transparent substrates using transmission measurements. The method consists in fitting to the experimentally recorded spectra, theoretical ones, generated simulating the optical dispersion of the films involved with the help of the physical model proposed by Forouhi and Bloomer for amorphous semiconductors [Phys. Rev. B 34, 7018 (1986)]. The fit is made using standard regression analysis techniques that allow determination of the model parameters corresponding to these films. This method is applied for amorphous Si layers deposited on fused silica substrates by low pressure chemical vapor deposition (CVD) and SnO2 films grown by atmospheric pressure CVD on glass substrates and give results that are in agreement with those reported in the literature.

  16. Surface melting of deuterium hydride thick films

    OpenAIRE

    Zeppenfeld, P.; Bienfait, M.; Feng Chuan Liu,; Vilches, O.E.; Coddens, G.

    1990-01-01

    Quasi-elastic neutron scattering has been used to measure, below the bulk melting temperature, the thickness and the diffusion coefficient of the mobile surface layer of 8 and 10 layer thick films of deuterium hydride (HD) condensed on MgO(100). The measurements show that the close-packed surface of solid HD surface melts gradually, with the thickness of the melted layer increasing from 0.5 to 6 molecular layers as the temperature rises from 4 K to 0.05 K below the bulk melting temperature. T...

  17. Measuring the Thickness and Elastic Properties of Electroactive Thin-film Polymers Using Platewave Dispersion Data

    Science.gov (United States)

    El-Azab, A.; Mal, A. K.; Bar-Cohen, Y.; Lih, S.

    1996-01-01

    Electroactive thin-film polymers are candidate sensors and actuators materials [1,2]. They are also finding a significant potential for applications in muscle mechanisms and micro-electro-mechanical systems (MEMS).

  18. doped ZnO thick film resistors

    Indian Academy of Sciences (India)

    The characterization and ethanol gas sensing properties of pure and doped ZnO thick films were investigated. Thick films of pure zinc oxide were prepared by the screen printing technique. Pure zinc oxide was almost insensitive to ethanol. Thick films of Al2O3 (1 wt%) doped ZnO were observed to be highly sensitive to ...

  19. [Epidemiologic study of tear film lipid layer thickness measurement in the population of Taishitun Community in Beijing].

    Science.gov (United States)

    Liang, Q F; Du, X H; Su, Y D; Wang, N L; Wei, Z J; Labbé, Antoine

    2017-07-11

    Objective: To investigate the distribution of tear film lipid layer thickness (LLT) and the relationship between symptoms and signs of dry eye and tear film LLT in the population of Taishitun Community in Beijing. Methods: A cross-sectional study. From May 2016 to August 2016, three streets of Taishitun Community were randomly selected as survey districts and 540 persons were taken as investigation subjects. Every participant completed 6 items of dry eye examinations as follows: questionnaire (Ocular Surface Disease Index, OSDI), measurement of tear film LLT, tear film break-up time (TBUT), corneal and conjunctival staining, SchirmerⅠtest and the infrared meibomian photography. According to their age, all participants were divided into four groups: junior group (analysis and multivariate Logistic regression analysis, distribution of the variables of LLT and the relationship between dry eye symptoms and LLT were studied. Results: A total of 473 residents finally participated in this study, and the response ratio was 87.6%. The values of LLT were normally distributed. The average LLT was (59.87±18.50) nm [(60.16±19.15) nm in males and (59.67±18.57) nm in females], and the comparison of LLT with different genders was not statistically significant ( t= 0.198, P= 0.843). The tear film LLT of four different age groups had statistical significance ( F= 15.092, P0.05. F= 0.538, P >0.05). In the OSDI symptom questionnaire, only blurred vision and decreased visual acuity were related to the tear film LLT ( Pfilm LLT ( P> 0.05). Conclusions: In Taishitun Community of Beijing, the values of tear film LLT had a normal distribution. The LLT was positively correlated with age, but inversely correlated with the severity of the symptoms of dry eye. There was no significant correlation between the LLT and the TBUT, SchirmerⅠtest result and meibomian gland loss rate. (Chin J Ophthalmol, 2017, 53: 495-501) .

  20. Oil film thickness measurement and analysis for an angular contact ball bearing operating in parched elastohydrodynamic lubrication. M.S. Thesis. Final Report

    Science.gov (United States)

    Hunter, Scott D.

    1986-01-01

    The capacitance method is used to estimate the oil film thickness in the Hertzian contact zone of an angular contact ball bearing operating in parched elastohydrodynamic lubrication. The parched elastohydrodynamic lubrication regime is characterized by a transient film thickness and basic speed ratio (ball spin rate over combined race speed) and the formation of a friction polymer. The experimental apparatus tests 40 mm 108 H ball bearings in the counter rotating race mode at loads of 200 and 300 lb, a film parameter of 1.6 and nominal inner and outer race speeds of 38 and 26 rps, respectively. Experimental results are presented for the capacitance, thickness, and conductance of the oil film as functions of elapsed time and for the basic speed ratios as a function of elapsed time, load, and amount of lubricant applied to the test bearing. Results indicate that a friction polymer formed from the initial lubricant has an effect on the capacitance and basic speed ratio measurements.

  1. Percolation effect in thick film superconductors

    International Nuclear Information System (INIS)

    Sali, R.; Harsanyi, G.

    1994-01-01

    A thick film superconductor paste has been developed to study the properties of granulated superconductor materials, to observe the percolation effect and to confirm the theory of the conducting mechanism in the superconducting thick films. This paste was also applied to make a superconducting planar transformer. Due to high T c and advantageous current density properties the base of the paste was chosen to be of Bi(Pb)SrCaCuO system. For contacts a conventional Ag/Pt paste was used. The critical temperature of the samples were between 110 K and 115 K depending on the printed layer thickness. The critical current density at the boiling temperature of the liquid He- was between 200-300 A/cm 2 . The R(T) and V(I) functions were measured with different parameters. The results of the measurements have confirmed the theory of conducting mechanism in the material. The percolation structure model has been built and described. As an application, a superconducting planar thick film transformer was planned and produced. Ten windings of the transformer were printed on one side of the alumina substrate and one winding was printed on the other side. The coupling between the two sides was possible through the substrate. The samples did not need special drying and firing parameters. After the preparation, the properties of the transformer were measured. The efficiency and the losses were determined. Finally, some fundamental advantages and problems of the process were discussed

  2. Accurate thickness measurement of graphene

    International Nuclear Information System (INIS)

    Shearer, Cameron J; Slattery, Ashley D; Stapleton, Andrew J; Shapter, Joseph G; Gibson, Christopher T

    2016-01-01

    Graphene has emerged as a material with a vast variety of applications. The electronic, optical and mechanical properties of graphene are strongly influenced by the number of layers present in a sample. As a result, the dimensional characterization of graphene films is crucial, especially with the continued development of new synthesis methods and applications. A number of techniques exist to determine the thickness of graphene films including optical contrast, Raman scattering and scanning probe microscopy techniques. Atomic force microscopy (AFM), in particular, is used extensively since it provides three-dimensional images that enable the measurement of the lateral dimensions of graphene films as well as the thickness, and by extension the number of layers present. However, in the literature AFM has proven to be inaccurate with a wide range of measured values for single layer graphene thickness reported (between 0.4 and 1.7 nm). This discrepancy has been attributed to tip-surface interactions, image feedback settings and surface chemistry. In this work, we use standard and carbon nanotube modified AFM probes and a relatively new AFM imaging mode known as PeakForce tapping mode to establish a protocol that will allow users to accurately determine the thickness of graphene films. In particular, the error in measuring the first layer is reduced from 0.1–1.3 nm to 0.1–0.3 nm. Furthermore, in the process we establish that the graphene-substrate adsorbate layer and imaging force, in particular the pressure the tip exerts on the surface, are crucial components in the accurate measurement of graphene using AFM. These findings can be applied to other 2D materials. (paper)

  3. Thickness evaluation using a new relationship between film density and penetrated thickness in radiography

    International Nuclear Information System (INIS)

    Lee, Sung Sik; Kim, Young H.

    2005-01-01

    In order to improve the accuracies in the thickness evaluation using radiography, a new relationship between film density and penetrated thickness has been proposed, and experimental verification of the proposed relationship was carried out by using the X- and γ-ray radiographs of two carbon steel step wedges. A new parameter, the logarithmic gradient of film density, was defined in order to express the characteristics of the radiographic film for wider range of film density. A new relationship between the film density and the penetrated thickness were formulated using the logarithmic gradient of the film density. In experiment, the logarithmic gradient of the film density was independent on both the exposure and the film density and measured for the radiographic film used in the present work from the slope of the fitting lines for the same penetrated thickness. Experimental results verifies the accuracy of the proposed relationship between film density and the penetrated thickness for the range of film density from 1.0 to 3.5. The thickness can be more accurately determined by using the proposed relationship and the parameters determined by experiment. It is also found that the γ-ray having simple energy spectrum is more appropriate radiation source for the evaluation of the thickness from the film density of the radiograph

  4. Fuel film thickness measurements using refractive index matching in a stratified-charge SI engine operated on E30 and alkylate fuels

    Science.gov (United States)

    Ding, Carl-Philipp; Sjöberg, Magnus; Vuilleumier, David; Reuss, David L.; He, Xu; Böhm, Benjamin

    2018-03-01

    This study shows fuel film measurements in a spark-ignited direct injection engine using refractive index matching (RIM). The RIM technique is applied to measure the fuel impingement of a high research octane number gasoline fuel with 30 vol% ethanol content at two intake pressures and coolant temperatures. Measurements are conducted for an alkylate fuel at one operating case, as well. It is shown that the fuel volume on the piston surface increases for lower intake pressure and lower coolant temperature and that the alkylate fuel shows very little spray impingement. The fuel films can be linked to increased soot emissions. A detailed description of the calibration technique is provided and measurement uncertainties are discussed. The dependency of the RIM signal on refractive index changes is measured. The RIM technique provides quantitative film thickness measurements up to 0.9 µm in this engine. For thicker films, semi-quantitative results of film thickness can be utilized to study the distribution of impinged fuel.

  5. Coating thickness measuring device

    International Nuclear Information System (INIS)

    Joffe, B.B.; Sawyer, B.E.; Spongr, J.J.

    1984-01-01

    A device especially adapted for measuring the thickness of coatings on small, complexly-shaped parts, such as, for example, electronic connectors, electronic contacts, or the like. The device includes a source of beta radiation and a radiation detector whereby backscatter of the radiation from the coated part can be detected and the thickness of the coating ascertained. The radiation source and detector are positioned in overlying relationship to the coated part and a microscope is provided to accurately position the device with respect to the part. Means are provided to control the rate of descent of the radiation source and radiation detector from its suspended position to its operating position and the resulting impact it makes with the coated part to thereby promote uniformity of readings from operator to operator, and also to avoid excessive impact with the part, thereby improving accuracy of measurement and eliminating damage to the parts

  6. NdFeB thick films prepared by tape casting

    International Nuclear Information System (INIS)

    Pawlowski, B.; Schwarzer, S.; Rahmig, A.; Toepfer, J.

    2003-01-01

    NdFeB films of thickness between 100 and 800 μm were prepared by tape casting of a slurry containing 84-95 wt% of commercial NdFeB powder (MQP-B, -Q and -S). After curing the flexible green tapes at 120 deg. C non-porous magnetic films are obtained. The remanence of the films is in the range of 350-450 mT and the coercivity is between 300 and 800 kA/m depending on the type of MQP powder used. The magnetic properties of the films are discussed in relation to film composition and type of magnetic material. For MEMS applications the thick films are magnetized with a multi-pole stripe pattern with 1 mm pole pitch. The induction at the surface of the films was measured with a Hall probe and compared to theoretical calculations. The results indicate that the films are completely magnetized regardless of the film thickness. Tape-casted NdFeB thick films are promising candidates for applications in micro-systems or actuators. Miniaturization of the magnet components is one of the key issues in the development of electromagnetic micro-systems, thus creating a need for replacement of small sintered magnets by magnetic thick film components. Other applications include encoders

  7. Barium titanate thick films prepared by screen printing technique

    Directory of Open Access Journals (Sweden)

    Mirjana M. Vijatović

    2010-06-01

    Full Text Available The barium titanate (BaTiO3 thick films were prepared by screen printing technique using powders obtained by soft chemical route, modified Pechini process. Three different barium titanate powders were prepared: i pure, ii doped with lanthanum and iii doped with antimony. Pastes for screen printing were prepared using previously obtained powders. The thick films were deposited onto Al2O3 substrates and fired at 850°C together with electrode material (silver/palladium in the moving belt furnace in the air atmosphere. Measurements of thickness and roughness of barium titanate thick films were performed. The electrical properties of thick films such as dielectric constant, dielectric losses, Curie temperature, hysteresis loop were reported. The influence of different factors on electrical properties values was analyzed.

  8. One-step aerosol synthesis of nanoparticle agglomerate films: simulation of film porosity and thickness

    International Nuclear Information System (INIS)

    Maedler, Lutz; Lall, Anshuman A; Friedlander, Sheldon K

    2006-01-01

    A method is described for designing nanoparticle agglomerate films with desired film porosity and film thickness. Nanoparticle agglomerates generated in aerosol reactors can be directly deposited on substrates to form uniform porous films in one step, a significant advance over existing technologies. The effect of agglomerate morphology and deposition mechanism on film porosity and thickness are discussed. Film porosity was calculated for a given number and size of primary particles that compose the agglomerates, and fractal dimension. Agglomerate transport was described by the Langevin equation of motion. Deposition enhancing forces such as thermophoresis are incorporated in the model. The method was validated for single spherical particles using previous theoretical studies. An S-shape film porosity dependence on the particle Peclet number typical for spherical particles was also observed for agglomerates, but films formed from agglomerates had much higher porosities than films from spherical particles. Predicted film porosities compared well with measurements reported in the literature. Film porosities increased with the number of primary particles that compose an agglomerate and higher fractal dimension agglomerates resulted in denser films. Film thickness as a function of agglomerate deposition time was calculated from the agglomerate deposition flux in the presence of thermophoresis. The calculated film thickness was in good agreement with measured literature values. Thermophoresis can be used to reduce deposition time without affecting the film porosity

  9. Use of alpha-particle excited x-rays to measure the thickness of thin films containing low-Z elements

    International Nuclear Information System (INIS)

    Hanser, F.A.; Sellers, B.; Ziegler, C.A.

    1976-01-01

    The thickness of thin surface films containing low Z elements can be determined by measuring the K X-ray yields from alpha particle excitation. The samples are irradiated in a helium atmosphere by a 5 mCi polonium-210 source, and the low energy X-rays detected by a flow counter with a thin-stretched polypropylene window. The flow counter output is pulse height sorted by a single channel analyzer (SCA) and counted to give the X-ray yield. Best results have been obtained with Z = 6 to 9 (C, N, O, and F), but usable yields are obtained even for Z = 13 or 14 (Al and Si). The low energy of the X-rays (0.28 to 1.74 keV) limits the method to films of several hundred nm thickness or less and to situations where the substrate does not produce interfering X-rays. It is possible to determine the film thickness with 50 percent accuracy by direct calculation using the measured alpha-particle spectrum and known or calculated K X-ray excitation cross sections. By calibration with known standards the accuracy can be increased substantially. The system has thus far been applied to SiO 2 on Si, Al 2 O 3 on Al, and CH 2 on Al

  10. Thickness dependent properties of magnetic ultrathin films

    Energy Technology Data Exchange (ETDEWEB)

    Cong, Bach Thanh [Faculty of Physics, Hanoi University of Science, VNU, 334 Nguyen Trai, Hanoi (Viet Nam); Thao, Pham Huong, E-mail: hthao82@gmail.com [Faculty of Physics, Hanoi University of Science, VNU, 334 Nguyen Trai, Hanoi (Viet Nam); Faculty of Physics, Hue College of Education, 32 Le Loi, Thua Thien Hue (Viet Nam)

    2013-10-01

    The dependence of magnetic properties on the thickness of few-layer thin films is investigated at finite temperature using the functional integral method for solving the Heisenberg spin model. The temperature dependence of the ultra-thin film's magnetization and Curie temperature are calculated in terms of the mean field theory and of the Gaussian spin fluctuation approximations. It has been shown that both Curie temperature and temperature interval, where the magnetization is non-zero, are strongly reduced with the thickness reduction by using the spin fluctuation approximations in comparison with the mean field results. Curie temperature dependence on the film thickness calculated numerically well agrees with the experimental data for Ni/Cu(1 0 0) and Ni/Cu(1 1 1) ultrathin films.

  11. Measurement of Young’s modulus and volumetric mass density/thickness of ultrathin films utilizing resonant based mass sensors

    Czech Academy of Sciences Publication Activity Database

    Stachiv, Ivo; Vokoun, David; Jeng, Y.-R.

    2014-01-01

    Roč. 104, č. 8 (2014), "083102-1"-"083102-4" ISSN 0003-6951 R&D Projects: GA ČR GAP107/12/0800 Institutional support: RVO:68378271 Keywords : functional films * mass sensor * resonant frequency Subject RIV: JB - Sensors, Measurment, Regulation Impact factor: 3.302, year: 2014 http://scitation.aip.org/content/aip/journal/apl/104/8/10.1063/1.4866417

  12. Characterization and comparison of thermistor thick films. Topical report

    International Nuclear Information System (INIS)

    Gehman, R.W.

    1981-09-01

    Four thermistor thick film inks were evaluated for HMC production use. The physical, chemical and electrical properties of the wet inks and fired films were measured. Variations in the physical and chemical properties of the inks were used to explain variations in thermistor electrical resistance and temperature coefficient of resistance

  13. Hall and Seebeck measurements estimate the thickness of a (buried) carrier system: Identifying interface electrons in In-doped SnO2 films

    Science.gov (United States)

    Papadogianni, Alexandra; White, Mark E.; Speck, James S.; Galazka, Zbigniew; Bierwagen, Oliver

    2015-12-01

    We propose a simple method based on the combination of Hall and Seebeck measurements to estimate the thickness of a carrier system within a semiconductor film. As an example, this method can distinguish "bulk" carriers, with homogeneous depth distribution, from "sheet" carriers, that are accumulated within a thin layer. The thickness of the carrier system is calculated as the ratio of the integral sheet carrier concentration, extracted from Hall measurements, to the volume carrier concentration, derived from the measured Seebeck coefficient of the same sample. For rutile SnO2, the necessary relation of Seebeck coefficient to volume electron concentration in the range of 3 × 1017 to 3 × 1020 cm-3 has been experimentally obtained from a set of single crystalline thin films doped with varying Sb-doping concentrations and unintentionally doped bulk samples, and is given as a "calibration curve." Using this calibration curve, our method demonstrates the presence of interface electrons in homogeneously deep-acceptor (In) doped SnO2 films on sapphire substrates.

  14. Hall and Seebeck measurements estimate the thickness of a (buried) carrier system: Identifying interface electrons in In-doped SnO{sub 2} films

    Energy Technology Data Exchange (ETDEWEB)

    Papadogianni, Alexandra; Bierwagen, Oliver [Paul-Drude-Institut für Festkörperelektronik, Hausvogteiplatz 5-7, D-10117 Berlin (Germany); White, Mark E.; Speck, James S. [Materials Department, University of California, Santa Barbara, California 93106 (United States); Galazka, Zbigniew [Leibniz-Institut für Kristallzüchtung, Max-Born-Straße 2, D-12489 Berlin (Germany)

    2015-12-21

    We propose a simple method based on the combination of Hall and Seebeck measurements to estimate the thickness of a carrier system within a semiconductor film. As an example, this method can distinguish “bulk” carriers, with homogeneous depth distribution, from “sheet” carriers, that are accumulated within a thin layer. The thickness of the carrier system is calculated as the ratio of the integral sheet carrier concentration, extracted from Hall measurements, to the volume carrier concentration, derived from the measured Seebeck coefficient of the same sample. For rutile SnO{sub 2}, the necessary relation of Seebeck coefficient to volume electron concentration in the range of 3 × 10{sup 17} to 3 × 10{sup 20 }cm{sup −3} has been experimentally obtained from a set of single crystalline thin films doped with varying Sb-doping concentrations and unintentionally doped bulk samples, and is given as a “calibration curve.” Using this calibration curve, our method demonstrates the presence of interface electrons in homogeneously deep-acceptor (In) doped SnO{sub 2} films on sapphire substrates.

  15. Triaxial MEMS accelerometer with screen printed PZT thick film

    DEFF Research Database (Denmark)

    Hindrichsen, Christian Carstensen; Almind, Ninia Sejersen; Brodersen, Simon Hedegaard

    2010-01-01

    Piezoelectric thick films have increasing interest due to the potential high sensitivity and actuation force for MEMS sensors and actuators. The screen printing technique is a promising deposition technique for realizing piezoelectric thick films in the thickness range from 10-100 mu m....... In this work integration of a screen printed piezoelectric PZT thick film with silicon MEMS technology is shown. A high bandwidth triaxial accelerometer has been designed, fabricated and characterized. The voltage sensitivity is 0.31 mV/g in the vertical direction, 0.062 mV/g in the horizontal direction...... and the first mode resonance frequency is 11 kHz. A Finite Element Method (FEM) model is used to validate the measured sensitivity and resonance frequency. Good agreement between the model and the measurements is seen....

  16. High-throughput characterization of film thickness in thin film materials libraries by digital holographic microscopy

    Directory of Open Access Journals (Sweden)

    Yiu Wai Lai, Michael Krause, Alan Savan, Sigurd Thienhaus, Nektarios Koukourakis, Martin R Hofmann and Alfred Ludwig

    2011-01-01

    Full Text Available A high-throughput characterization technique based on digital holography for mapping film thickness in thin-film materials libraries was developed. Digital holographic microscopy is used for fully automatic measurements of the thickness of patterned films with nanometer resolution. The method has several significant advantages over conventional stylus profilometry: it is contactless and fast, substrate bending is compensated, and the experimental setup is simple. Patterned films prepared by different combinatorial thin-film approaches were characterized to investigate and demonstrate this method. The results show that this technique is valuable for the quick, reliable and high-throughput determination of the film thickness distribution in combinatorial materials research. Importantly, it can also be applied to thin films that have been structured by shadow masking.

  17. Real-time measurement system for tracking birefringence, weight, thickness, and surface temperature during drying of solution cast coatings and films

    Science.gov (United States)

    Unsal, E.; Drum, J.; Yucel, O.; Nugay, I. I.; Yalcin, B.; Cakmak, M.

    2012-02-01

    This paper describes the design and performance of a new instrument to track temporal changes in physical parameters during the drying behavior of solutions, as well as curing of monomers. This real-time instrument follows in-plane and out-of-plane birefringence, weight, thickness, and surface temperature during the course of solidification of coatings and films through solvent evaporation and thermal or photocuring in a controlled atmosphere. It is specifically designed to simulate behavior of polymer solutions inside an industrial size, continuous roll-to-roll solution casting line and other coating operations where resins are subjected to ultraviolet (UV) curing from monomer precursors. Controlled processing parameters include air speed, temperature, initial cast thickness, and solute concentration, while measured parameters are thickness, weight, film temperature, in-plane and out-of-plane birefringence. In this paper, we illustrate the utility of this instrument with solution cast and dried poly (amide-imide)/DMAc (Dimethylacetamide) solution, water based black paint, and organo-modified clay/NMP (N-Methylpyrrolidone) solution. In addition, the physical changes that take place during UV photo polymerization of a monomer are tracked. This instrument is designed to be generic and it can be used for tracking any drying/swelling/solidification systems including paper, foodstuffs such as; grains, milk as well as pharmaceutical thin paste and slurries.

  18. Thin dielectric film thickness determination by advanced transmission electron microscopy

    Energy Technology Data Exchange (ETDEWEB)

    Diebold, A.C.; Foran, B.; Kisielowski, C.; Muller, D.; Pennycook, S.; Principe, E.; Stemmer, S.

    2003-09-01

    High Resolution Transmission Electron Microscopy (HR-TEM) has been used as the ultimate method of thickness measurement for thin films. The appearance of phase contrast interference patterns in HR-TEM images has long been confused as the appearance of a crystal lattice by non-specialists. Relatively easy to interpret crystal lattice images are now directly observed with the introduction of annular dark field detectors for scanning TEM (STEM). With the recent development of reliable lattice image processing software that creates crystal structure images from phase contrast data, HR-TEM can also provide crystal lattice images. The resolution of both methods was steadily improved reaching now into the sub Angstrom region. Improvements in electron lens and image analysis software are increasing the spatial resolution of both methods. Optimum resolution for STEM requires that the probe beam be highly localized. In STEM, beam localization is enhanced by selection of the correct aperture. When STEM measurement is done using a highly localized probe beam, HR-TEM and STEM measurement of the thickness of silicon oxynitride films agree within experimental error. In this paper, the optimum conditions for HR-TEM and STEM measurement are discussed along with a method for repeatable film thickness determination. The impact of sample thickness is also discussed. The key result in this paper is the proposal of a reproducible method for film thickness determination.

  19. Properties of conductive thick-film inks

    Science.gov (United States)

    Holtze, R. F.

    1972-01-01

    Ten different conductive inks used in the fabrication of thick-film circuits were evaluated for their physical and handling properties. Viscosity, solid contents, and spectrographic analysis of the unfired inks were determined. Inks were screened on ceramic substrates and fired for varying times at specified temperatures. Selected substrates were given additional firings to simulate the heat exposure received if thick-film resistors were to be added to the same substrate. Data are presented covering the (1) printing characteristics, (2) solderability using Sn-63 and also a 4 percent silver solder, (3) leach resistance, (4) solder adhesion, and (5) wire bonding properties. Results obtained using different firing schedules were compared. A comparison was made between the various inks showing general results obtained for each ink. The changes in firing time or the application of a simulated resistor firing had little effect on the properties of most inks.

  20. Metallic oxide switches using thick film technology

    Science.gov (United States)

    Patel, D. N.; Williams, L., Jr.

    1974-01-01

    Metallic oxide thick film switches were processed on alumina substrates using thick film technology. Vanadium pentoxide in powder form was mixed with other oxides e.g., barium, strontium copper and glass frit, ground to a fine powder. Pastes and screen printable inks were made using commercial conductive vehicles and appropriate thinners. Some switching devices were processed by conventional screen printing and firing of the inks and commercial cermet conductor terminals on 96% alumina substrates while others were made by applying small beads or dots of the pastes between platinum wires. Static, and dynamic volt-ampere, and pulse tests indicate that the switching and self-oscillatory characteristics of these devices could make them useful in memory element, oscillator, and automatic control applications.

  1. Substrate morphology repetition in 'thick' polymer films

    International Nuclear Information System (INIS)

    Pietsch, Ullrich; Panzner, Tobias; Pfeiffer, Franz; Robinson, Ian K.

    2005-01-01

    Using Grazing-incidence small-angle scattering (GISAXS) technique we investigated the surface morphology of polymer films spin-coated on different silicon substrates. As substrates we used either technologically smooth silicon wafers or the same silicon wafer coated with thin aluminium or gold films which show a granular structure at the surface. Although the polymer thickness exceeds 300nm the GISAXS pattern of the film shows the same in-plane angle distribution Δ2Θ as the underlying substrate. Annealing the polymer films at a temperature above its glass transition temperature Δ2Θ changed from a broad to a narrow distribution as it is typically for films on pure silicon. The experiment can be interpreted by roughness replication and density fluctuation within the polymer film created while spin-coating at room temperature. Due to the low segment mobility there are density fluctuations which repeat the surface morphology of the substrate. Above the glass temperature the polymer density can be homogenized independently from the morphology of the substrate

  2. Hexaferrite multiferroics: from bulk to thick films

    Science.gov (United States)

    Koutzarova, T.; Ghelev, Ch; Peneva, P.; Georgieva, B.; Kolev, S.; Vertruyen, B.; Closset, R.

    2018-03-01

    We report studies of the structural and microstructural properties of Sr3Co2Fe24O41 in bulk form and as thick films. The precursor powders for the bulk form were prepared following the sol-gel auto-combustion method. The prepared pellets were synthesized at 1200 °C to produce Sr3Co2Fe24O41. The XRD spectra of the bulks showed the characteristic peaks corresponding to the Z-type hexaferrite structure as a main phase and second phases of CoFe2O4 and Sr3Fe2O7-x. The microstructure analysis of the cross-section of the bulk pellets revealed a hexagonal sheet structure. Large areas were observed of packages of hexagonal sheets where the separate hexagonal particles were ordered along the c axis. Sr3Co2Fe24O41 thick films were deposited from a suspension containing the Sr3Co2Fe24O41 powder. The microstructural analysis of the thick films showed that the particles had the perfect hexagonal shape typical for hexaferrites.

  3. Thick-film analysis: literature search and bibliography

    International Nuclear Information System (INIS)

    Gehman, R.W.

    1981-09-01

    A literature search was conducted to support development of in-house diagnostic testing of thick film materials for hybrid microcircuits. A background literature review covered thick film formulation, processing, structure, and performance. Important material properties and tests were identified and several test procedures were obtained. Several tests were selected for thick film diagnosis at Bendix Kansas City. 126 references

  4. Ethanol vapour sensing properties of screen printed WO3 thick films

    Indian Academy of Sciences (India)

    This paper presents ethanol vapour sensing properties of WO3 thick films. In this work, the WO3 thick films were prepared by standard screen-printing method. These films were characterized by X-ray diffraction (XRD) measurements and scanning electron microscopy (SEM). The ethanol vapour sensing properties of these ...

  5. Ethanol vapour sensing properties of screen printed WO3 thick films

    Indian Academy of Sciences (India)

    TECS

    Abstract. This paper presents ethanol vapour sensing properties of WO3 thick films. In this work, the WO3 thick films were prepared by standard screen-printing method. These films were characterized by X-ray diffraction (XRD) measurements and scanning electron microscopy (SEM). The ethanol vapour sensing pro-.

  6. Film Thickness and Friction Relationship in Grease Lubricated Rough Contacts

    Directory of Open Access Journals (Sweden)

    David Gonçalves

    2017-08-01

    Full Text Available The relationship between the film generation and the coefficient of friction in grease lubricated contacts was investigated. Ball-on-disc tests were performed under different operating conditions: entrainment speed, lubricant temperature and surface roughness. The tests were performed with fully formulated greases and their base oils. The greases were formulated with different thickener types and also different base oils natures and viscosities. Film thickness measurements were performed in ball-on-glass disc tests, and Stribeck curves were measured in ball-on-steel disc tests with discs of different roughness. The role of the thickener and the base oil nature/viscosity on the film thickness and coefficient of friction was addressed and the greases’ performance was compared based on their formulation.

  7. Electron beam curable polymer thick film

    International Nuclear Information System (INIS)

    Nagata, Hidetoshi; Kobayashi, Takashi

    1988-01-01

    Currently, most printed circuit boards are produced by the selective etching of copper clads laminated on dielectric substrates such as paper/phenolic resion or nonwoven glass/epoxy resin composites. After the etchig, various components such as transistors and capacitors are mounted on the boards by soldering. But these are troublesome works, therefore, as an alternative, printing method has been investigated recently. In the printing method, conductor circuits and resistors can be made by printing and curing of the specially prepared paste on dielectric substrates. In the near future, also capacitors are made by same method. Usually, conductor paste, resistor paste and dielectric paste are employed, and in this case, the printing is screen printing, and the curing is done thermally. In order to avoid heating and the deterioration of substrates, attention was paid to electron beam curing, and electron beam curable polymer thick film system was developed. The electron beam curable paste is the milled mixture of a filler and an electron beam curable binder of oligomer/monomer. The major advantage of electron beam curable polymer thick film, the typical data of a printed resistor of this type and its trial are reported. (K.I.)

  8. An improved algorithm of image processing technique for film thickness measurement in a horizontal stratified gas-liquid two-phase flow

    Energy Technology Data Exchange (ETDEWEB)

    Kuntoro, Hadiyan Yusuf, E-mail: hadiyan.y.kuntoro@mail.ugm.ac.id; Majid, Akmal Irfan; Deendarlianto, E-mail: deendarlianto@ugm.ac.id [Center for Energy Studies, Gadjah Mada University, Sekip K-1A Kampus UGM, Yogyakarta 55281 (Indonesia); Department of Mechanical and Industrial Engineering, Faculty of Engineering, Gadjah Mada University, Jalan Grafika 2, Yogyakarta 55281 (Indonesia); Hudaya, Akhmad Zidni; Dinaryanto, Okto [Department of Mechanical and Industrial Engineering, Faculty of Engineering, Gadjah Mada University, Jalan Grafika 2, Yogyakarta 55281 (Indonesia)

    2016-06-03

    Due to the importance of the two-phase flow researches for the industrial safety analysis, many researchers developed various methods and techniques to study the two-phase flow phenomena on the industrial cases, such as in the chemical, petroleum and nuclear industries cases. One of the developing methods and techniques is image processing technique. This technique is widely used in the two-phase flow researches due to the non-intrusive capability to process a lot of visualization data which are contain many complexities. Moreover, this technique allows to capture direct-visual information data of the flow which are difficult to be captured by other methods and techniques. The main objective of this paper is to present an improved algorithm of image processing technique from the preceding algorithm for the stratified flow cases. The present algorithm can measure the film thickness (h{sub L}) of stratified flow as well as the geometrical properties of the interfacial waves with lower processing time and random-access memory (RAM) usage than the preceding algorithm. Also, the measurement results are aimed to develop a high quality database of stratified flow which is scanty. In the present work, the measurement results had a satisfactory agreement with the previous works.

  9. Multiple High Voltage Pulse Stressing of Polymer Thick Film Resistors

    Directory of Open Access Journals (Sweden)

    Busi Rambabu

    2014-01-01

    Full Text Available The purpose of this paper is to study high voltage interactions in polymer thick film resistors, namely, polyvinyl chloride- (PVC- graphite thick film resistors, and their applications in universal trimming of these resistors. High voltages in the form of impulses for various pulse durations and with different amplitudes have been applied to polymer thick film resistors and we observed the variation of resistance of these resistors with high voltages. It has been found that the resistance of polymer thick film resistors decreases in the case of higher resistivity materials and the resistance of polymer thick film resistor increases in the case of lower resistivity materials when high voltage impulses are applied to them. It has been also found that multiple high voltage pulse (MHVP stressing can be used to trim the polymer thick film resistors either upwards or downwards.

  10. Influence of thickness on properties of plasticized oat starch films

    Directory of Open Access Journals (Sweden)

    Melicia Cintia Galdeano

    2013-08-01

    Full Text Available The aim of this study was to investigate the effect of thickness (between 80 and 120 µm on apparent opacity, water vapor permeability and mechanical properties (tensile and puncture of oat starch films plasticized with glycerol, sorbitol, glycerol:sorbitol mixture, urea and sucrose. Films were stored under 11, 57, 76 and 90% relative humidity (RH to study the mechanical properties. It was observed that the higher the thickness, the higher was the opacity values. Films without the plasticizer were more opaque in comparison with the plasticized ones. Glycerol:sorbitol films presented increased elongation with increasing thickness at all RH. Puncture force showed a strong dependence on the film thickness, except for the films plasticized with sucrose. In general, thickness did not affect the water permeability.

  11. Enhanced piezoelectric performance of composite sol-gel thick films evaluated using piezoresponse force microscopy

    Science.gov (United States)

    Liu, Yuanming; Lam, Kwok Ho; Kirk Shung, K.; Li, Jiangyu; Zhou, Qifa

    2013-01-01

    Conventional composite sol-gel method has been modified to enhance the piezoelectric performance of ceramic thick films. Lead zirconate titanate (PZT) and lead magnesium niobate–lead titanate (PMN-PT) thick films were fabricated using the modified sol-gel method for ultrasonic transducer applications. In this work, piezoresponse force microscopy was employed to evaluate the piezoelectric characteristics of PZT and PMN-PT composite sol-gel thick films. The images of the piezoelectric response and the strain-electric field hysteresis loop behavior were measured. The effective piezoelectric coefficient (d33,eff) of the films was determined from the measured loop data. It was found that the effective local piezoelectric coefficient of both PZT and PMN-PT composite films is comparable to that of their bulk ceramics. The promising results suggest that the modified composite sol-gel method is a promising way to prepare the high-quality, crack-free ceramic thick films. PMID:23798771

  12. Hydrodynamic film thickness measurements and CFD analysis identify the root causes of repetitive thrust bearing failures on a 45 MW hydro generating unit at Hydro-Québec

    Science.gov (United States)

    Gauvin, P.; Huard, P.

    2016-11-01

    High temperature level recorded on the thrust bearing of a 45 MW hydro generating unit was resulting in frequent production stoppage. In spite of improvements brought to the oil cooling system since the rehabilitation in 2008, the operator had to activate the bearing oil lift system to keep the temperature below acceptable limits. Primary root cause analysis first pointed to the design of the shoe that was centrally pivoted, not allowing the formation of a thick hydrodynamic film. The removal of a strip of the soft metal layer near the trailing edge of the shoe resulted in a significant surface temperature reduction (about 15 deg. C), as predicted by a CFD model of the oil film. The goal of this machining was to increase the pivoting angle by moving the centre of hydrodynamic pressure. Proximity sensors were installed at each corner of the redesigned shoe to measure the film thickness and the bearing attitude. Signal analysis revealed a step of a magnitude close to the oil film thickness between the two halves of the rotating thrust block. This was the cause of another failure few hours since restarting the unit. The lessons learnt through these measurements and analyses were carefully applied to the ultimate build. The unit now runs with a robust thrust bearing and even survived a significant cooling flow reduction event. This paper presents the CFD analysis results and the measurements acquired during these events.

  13. The effect of bubble acceleration on the liquid film thickness in micro tubes

    Energy Technology Data Exchange (ETDEWEB)

    Han, Youngbae, E-mail: bhan@feslab.t.u-tokyo.ac.j [Department of Mechanical Engineering, University of Tokyo, Hongo 7-3-1, Bunkyo-ku, Tokyo 113-8656 (Japan); Shikazono, Naoki, E-mail: shika@feslab.t.u-tokyo.ac.j [Department of Mechanical Engineering, University of Tokyo, Hongo 7-3-1, Bunkyo-ku, Tokyo 113-8656 (Japan)

    2010-08-15

    Liquid film thickness is an important parameter for predicting boiling heat transfer in micro tubes. In the previous study (), liquid film thickness under the steady condition was investigated and an empirical correlation for the initial liquid film thickness based on capillary number, Reynolds number and Weber number was proposed. However, under flow boiling conditions, bubble velocity is not constant but accelerated due to evaporation. It is necessary to consider this bubble acceleration effect on the liquid film thickness, since it affects viscous, surface tension and inertia forces in the momentum equation. In addition, viscous boundary layer develops, and it may also affect the liquid film thickness. In the present study, the effect of bubble acceleration is investigated. Laser focus displacement meter is used to measure the liquid film thickness. Ethanol, water and FC-40 are used as working fluids. Circular tubes with three different inner diameters, D = 0.5, 0.7 and 1.0 mm, are used. The increase of liquid film thickness with capillary number is restricted by the bubble acceleration. Finally, an empirical correlation is proposed for the liquid film thickness of accelerated flows in terms of capillary number and Bond number based on the bubble acceleration.

  14. Subtractive fabrication of ferroelectric thin films with precisely controlled thickness

    Science.gov (United States)

    Ievlev, Anton V.; Chyasnavichyus, Marius; Leonard, Donovan N.; Agar, Joshua C.; Velarde, Gabriel A.; Martin, Lane W.; Kalinin, Sergei V.; Maksymovych, Petro; Ovchinnikova, Olga S.

    2018-04-01

    The ability to control thin-film growth has led to advances in our understanding of fundamental physics as well as to the emergence of novel technologies. However, common thin-film growth techniques introduce a number of limitations related to the concentration of defects on film interfaces and surfaces that limit the scope of systems that can be produced and studied experimentally. Here, we developed an ion-beam based subtractive fabrication process that enables creation and modification of thin films with pre-defined thicknesses. To accomplish this we transformed a multimodal imaging platform that combines time-of-flight secondary ion mass spectrometry with atomic force microscopy to a unique fabrication tool that allows for precise sputtering of the nanometer-thin layers of material. To demonstrate fabrication of thin-films with in situ feedback and control on film thickness and functionality we systematically studied thickness dependence of ferroelectric switching of lead-zirconate-titanate, within a single epitaxial film. Our results demonstrate that through a subtractive film fabrication process we can control the piezoelectric response as a function of film thickness as well as improve on the overall piezoelectric response versus an untreated film.

  15. Advanced Metrologies for Topography and Thickness Measurements

    Science.gov (United States)

    Riou, G.; Acosta, P.; Darwin, M.; Kamenev, B.

    2011-11-01

    Despite its limitations, like the low through put, Atomic force microscopy (AFM) is in common use in the semiconductor industry for surface geometry characterization. Recent development in optical profilometry, Index Corrected Topography (ICT), further expands the technique by analysis of the collected interferograms to extract films parameters (thickness, for instance) and surface topography. This model based technique delivers literally complete information (e.g. topography, roughness, filmstack properties) of measured structure with sub-micron lateral resolution and angstrom vertical resolution. The approach is a strong asset since it allows contact less topography measurement of wafer surfaces. In this paper we will show how this specific metrology can meet the aforementioned stringent requirements. The comparison with both the AFM and the spectroscopic ellipsometry will be presented.

  16. Measuring Rind Thickness on Polyurethane Foam

    Science.gov (United States)

    Johnson, C.; Miller, J.; Brown, H.

    1985-01-01

    Nondestructive test determines rind thickness of polyurethane foam. Surface harness of foam measured by Shore durometer method: hardness on Shore D scale correlates well with rind thickness. Shore D hardness of 20, for example, indicates rind thickness of 0.04 inch (1 millimeter). New hardness test makes it easy to determine rind thickness of sample nondestructively and to adjust fabrication variables accordingly.

  17. Thickness and uniformity measurements of nuclear targets

    International Nuclear Information System (INIS)

    Xu Guoji; Meng Xiangjin; Luo Xinghua; Guan Shouren

    1987-06-01

    This paper introduces the methods of target thickness and uniformity measurements including weighing, α-particle thickness gauge, quartz thickness gauge, optical transmittance and Rutherford backscattering. An α-particle gauging which measures target thicknesses up to several μm is metioned. A fast thickness measurements for C, Au and Cu targets by spectrophotometer is given. A high sensitive quartz gauge which can measure minimum deposit of 0.04 μg/cm 2 is described. Thickness and impurity determinations by RBS with accuracy better than 5% are summarized

  18. Optimization of phantom backscatter thickness and lateral scatter volume for radiographic film dosimetry

    International Nuclear Information System (INIS)

    Srivastava, R.P.; De Wagter, C.

    2012-01-01

    The aim of this study is to determine the optimal backscatter thickness and lateral phantom dimension beyond the irradiated volume for the dosimetric verification with radiographic film when applying large field sizes. Polystyrene and Virtual Water™ phantoms were used to study the influence of the phantom backscatter thickness. EDR2 and XV films were used in 6 and 18 MV photon beams. The results show 11.4% and 6.4% over-response of the XV2 film when compared to the ion chamber for 6 MV 30×30 and 10×10 cm 2 field sizes, respectively, when the phantom backscatter thickness is 5 cm. For the same setup, measurements with EDR2 films indicate 8.5% and 1.7% over-response. The XV2 film response in the polystyrene phantom is about 2.0% higher than in the Virtual Water™ phantom for the 6 MV beam and 20 cm backscatter thickness. Similar results were obtained for EDR2 film. In the lateral scatter study, film response was nearly constant within 5 cm of lateral thickness and it increases when lateral thickness increases due to more multiple scatter of low energy photons. The backscatter thickness of the phantom should be kept below 7 cm for the accuracy of the film dosimetry. The lateral extension of the phantom should not be more than 5 cm from the field boundary in case of large irradiated volumes.

  19. Determination of oxide film thickness on aluminium using 14-MeV neutron activation and BET method

    International Nuclear Information System (INIS)

    Foerster, H.

    1983-01-01

    A new method is described for the determination of the mean film thickness of aluminium oxides by 14-MeV neutron activation analysis of the oxygen and by BET measurement of the surface area. The mean film thickness obtained is independent of the surface roughness. Stable oxide films consisting of only a few atomic layers of oxygen are detected on aluminium. (author)

  20. Effects of Loading Frequency and Film Thickness on the Mechanical Behavior of Nanoscale TiN Film

    Science.gov (United States)

    Liu, Jin-na; Xu, Bin-shi; Wang, Hai-dou; Cui, Xiu-fang; Jin, Guo; Xing, Zhi-guo

    2017-09-01

    The mechanical properties of a nanoscale-thickness film material determine its reliability and service life. To achieve quantitative detection of film material mechanical performance based on nanoscale mechanical testing methods and to explore the influence of loading frequency of the cycle load on the fatigue test, a TiN film was prepared on monocrystalline silicon by magnetron sputtering. The microstructure of the nanoscale-thickness film material was characterized by using scanning electron microscopy and high-resolution transmission electron microscopy. The residual stress distribution of the thin film was obtained by using an electronic film stress tester. The hardness values and the fatigue behavior were measured by using a nanomechanical tester. Combined with finite element simulation, the paper analyzed the influence of the film thickness and loading frequency on the deformation, as well as the equivalent stress and strain. The results showed that the TiN film was a typical face-centered cubic structure with a large amount of amorphous. The residual compressive stress decreased gradually with increasing thin film thickness, and the influence of the substrate on the elastic modulus and hardness was also reduced. A greater load frequency would accelerate the dynamic fatigue damage that occurs in TiN films.

  1. Effect of pre-heating composites on film thickness

    OpenAIRE

    Goulart, Marcelo; Damin, Deisi Fátima; Melara, Rafael; Conceição, Andréa de Azevedo Brito

    2013-01-01

    Resin composite has been suggested as a luting material for aesthetic indirect restorations and temperature affects material viscosity. Reports of film thickness from new composites are important. The aim of this study was to analyze the influence of pre-heating two resin composites on its film thickness in order to use it as a luting agent for indirect restorations (inlays and onlays). Three materials were divided into 5 groups. Two resin composites, nanofilled (Z350 XT/3MESPE) and microhybr...

  2. Sputtering of Thick Deuterium Films by KeV Electrons

    DEFF Research Database (Denmark)

    Thestrup Nielsen, Birgitte; Svendsen, Winnie Edith; Schou, Jørgen

    1994-01-01

    Sputtering of thick films of solid deuterium up to several μm by keV electrons is reported for the first time. The sputtering yield increases within a narrow range of thicknesses around 1.6 μm by about 2 orders of magnitude for 1.5 keV electrons. A similar behavior has not been observed for ion...... bombardment. The yield enhancement is accompanied by an increasing electron accumulation in the film....

  3. Intrinsic flux pinning mechanisms in different thickness MgB2 films

    Directory of Open Access Journals (Sweden)

    C. Yang

    2017-03-01

    Full Text Available MgB2 films in four thickness (60 nm, 200nm, 600nm and 1μm have been fabricated by hybrid physical–chemical vapor deposition technique (HPCVD. By measuring the magnetization hysteresis loops and the resistivity, we have obtained the transport and magnetic properties of the four films. After that, the pinning mechanisms in them were discussed. Comparing the pinning behaviors in these ultrathin films, thin films and thick films, it was found that there exist different pinning types in MgB2 films of different thickness. In combination with the study of the surface morphology, cross-section and XRD results, we concluded that MgB2 films had different growth modes in different growth stages. For thin films, films grew along c axis, and grain boundaries acted as surface pinning. While for thick films, films grew along c axis at first, and then changed to a-b axis growth. As a result, the a-b axis grains acted as strong volume pinning.

  4. Thickness effect on properties of titanium film deposited by dc ...

    Indian Academy of Sciences (India)

    This paper reports effect of thickness on the properties of titanium (Ti) film deposited on Si/SiO2 (100) substrate using two different methods: d.c. magnetron sputtering and electron beam (e-beam) evaporation technique. The structural and morphological characterization of Ti film were performed using X-ray diffraction (XRD) ...

  5. Effects of thickness on electronic structure of titanium thin films

    Indian Academy of Sciences (India)

    Effects of thickness on the electronic structure of e-beam evaporated thin titanium films were studied using near-edge X-ray absorption fine structure (NEXAFS) technique at titanium 2,3 edge in total electron yield (TEY) mode and transmission yield mode. Thickness dependence of 2,3 branching ratio (BR) of titanium was ...

  6. Screen-printed piezoceramic thick films for miniaturised devices

    DEFF Research Database (Denmark)

    Lou-Moeller, R.; Hindrichsen, Christian Carstensen; Thamdrup, Lasse Højlund

    2007-01-01

    machining. On the other hand, the process of screen printing thick films involves potential problems of thermal matching and chemical compatibility at the processing temperatures between the functional film, the substrate and the electrodes. As an example of such a miniaturised device, a MEMS accelerometer......The development towards smaller devices with more functions integrated calls for new and improved manufacturing processes. The screen-printing process is quite well suited for miniaturised and integrated devices, since thick films can be produced in this manner without the need for further...

  7. Measurement of thickness of highly inhomogeneous crude oil slicks.

    Science.gov (United States)

    Cheemalapati, Surya; Forth, Heather P; Wang, Hao; Konnaiyan, Karthik Raj; Morris, Jeffrey M; Pyayt, Anna L

    2017-04-10

    As part of the Deepwater Horizon toxicity testing program, a number of laboratories generated oil slicks in the laboratory to study potential toxic effects of these oil slicks on aquatic organisms. Understanding the details of how these slicks affect aquatic organisms requires careful correlation between slick thickness and the observed detrimental effects. Estimating oil film thickness on water can be challenging since the traditional color-based technique used in the field is very imprecise. Also, as we demonstrate here, the films formed on the water surface are highly nonuniform on a microscale level, and thus uniform thin film thickness measurement techniques based on optical interference do not work. In this paper, we present a method that estimates the local thickness of weathered oil slicks formed on artificial seawater using light transmission and Beer-Lambert's law. Here, we demonstrate results of careful calibration together with the actual thickness estimation. Due to the heterogeneity of the slicks formed, we present slick thickness as a range of thicknesses collected from multiple points within the oil slick. In all the experiments we used oil samples provided by the Natural Resource Damage Assessment toxicity testing program for the Deepwater Horizon oil spill. Therefore, this study has an important practical value and successfully addresses unique challenges related to measurements involving complex, viscous, paste-like heterogeneous substances such as weathered crude oil.

  8. Effect of thickness on structural and electrical properties of Al-doped ZnO films

    Energy Technology Data Exchange (ETDEWEB)

    Garcés, F.A., E-mail: felipe.garces@santafe-conicet.gov.ar [Instituto de Física del Litoral (CONICET-UNL), Güemes 3450, Santa Fe S3000GLN (Argentina); Budini, N. [Instituto de Física del Litoral (CONICET-UNL), Güemes 3450, Santa Fe S3000GLN (Argentina); Arce, R.D.; Schmidt, J.A. [Instituto de Física del Litoral (CONICET-UNL), Güemes 3450, Santa Fe S3000GLN (Argentina); Facultad de Ingeniería Química, Universidad Nacional del Litoral, Santiago del Estero 2829, Santa Fe S3000AOM (Argentina)

    2015-01-01

    In this work, we have investigated the influence of thickness on structural and electrical properties of Al-doped ZnO films. Transparent conducting oxide films were grown by the spray pyrolysis technique from precursors prepared via the sol–gel method. We determined the structural properties of the films by performing X-ray diffraction and mosaicity measurements, which evidenced an increase of disorder and inhomogeneity between crystalline domains as the films thickened. This behavior was contrasted with results obtained from electrical measurements and was attributed to plastic deformation of the films as their thickness increased. As a result, the carrier mobility, the optical gap and the activation energy are affected due to emerging grain boundaries and a higher degree of disorder. - Highlights: • Al-doped ZnO thin films on glass with different thicknessesFilm thickness affects the morphological and electrical properties. • Increasing time deposition allows modification of resistivity and Hall mobility. • Mosaicity between crystalline domains increases with film thickness.

  9. Effect of thickness on structural and electrical properties of Al-doped ZnO films

    International Nuclear Information System (INIS)

    Garcés, F.A.; Budini, N.; Arce, R.D.; Schmidt, J.A.

    2015-01-01

    In this work, we have investigated the influence of thickness on structural and electrical properties of Al-doped ZnO films. Transparent conducting oxide films were grown by the spray pyrolysis technique from precursors prepared via the sol–gel method. We determined the structural properties of the films by performing X-ray diffraction and mosaicity measurements, which evidenced an increase of disorder and inhomogeneity between crystalline domains as the films thickened. This behavior was contrasted with results obtained from electrical measurements and was attributed to plastic deformation of the films as their thickness increased. As a result, the carrier mobility, the optical gap and the activation energy are affected due to emerging grain boundaries and a higher degree of disorder. - Highlights: • Al-doped ZnO thin films on glass with different thicknessesFilm thickness affects the morphological and electrical properties. • Increasing time deposition allows modification of resistivity and Hall mobility. • Mosaicity between crystalline domains increases with film thickness

  10. Magnetic Probe Construction using Thick-film Technology

    International Nuclear Information System (INIS)

    Takahashi, H.; Sakakibara, S.; Kubota, Y.; Yamada, H.

    2001-01-01

    Thick-film technology has been successfully adapted for the design and fabrication of magnetic probes of a new type suitable for use in the simultaneous ultra-high vacuum and high-temperature environment of a nuclear fusion device. The maximum usable temperature is expected to be around 900 degrees C. This new probe has a specific sensitivity (coupling area per unit volume) an order of magnitude higher than a conventional coil. The new probe in one implementation is capable of simultaneously measuring magnetic field in three orthogonal directions about a single spatial point and in two frequency ranges. Low-frequency coils have a measured coupling area of 296-323 cm squared and a frequency response of about 300 kHz. High-frequency coils have a design coupling area of 12-15 cm squared

  11. Miniaturized, Planar Ion-selective Electrodes Fabricated by Means of Thick-film Technology

    Directory of Open Access Journals (Sweden)

    Robert Koncki

    2006-04-01

    Full Text Available Various planar technologies are employed for developing solid-state sensorshaving low cost, small size and high reproducibility; thin- and thick-film technologies aremost suitable for such productions. Screen-printing is especially suitable due to itssimplicity, low-cost, high reproducibility and efficiency in large-scale production. Thistechnology enables the deposition of a thick layer and allows precise pattern control.Moreover, this is a highly economic technology, saving large amounts of the used inks. Inthe course of repetitions of the film-deposition procedure there is no waste of material dueto additivity of this thick-film technology. Finally, the thick films can be easily and quicklydeposited on inexpensive substrates. In this contribution, thick-film ion-selective electrodesbased on ionophores as well as crystalline ion-selective materials dedicated forpotentiometric measurements are demonstrated. Analytical parameters of these sensors arecomparable with those reported for conventional potentiometric electrodes. All mentionedthick-film strip electrodes have been totally fabricated in only one, fully automated thick-film technology, without any additional manual, chemical or electrochemical steps. In allcases simple, inexpensive, commercially available materials, i.e. flexible, plastic substratesand easily cured polymer-based pastes were used.

  12. Thickness of residual wetting film in liquid-liquid displacement

    Science.gov (United States)

    Beresnev, Igor; Gaul, William; Vigil, R. Dennis

    2011-08-01

    Core-annular flow is common in nature, representing, for example, how streams of oil, surrounded by water, move in petroleum reservoirs. Oil, typically a nonwetting fluid, tends to occupy the middle (core) part of a channel, while water forms a surrounding wall-wetting film. What is the thickness of the wetting film? A classic theory has been in existence for nearly 50 years offering a solution, although in a controversial manner, for moving gas bubbles. On the other hand, an acceptable, experimentally verified theory for a body of one liquid flowing in another has not been available. Here we develop a hydrodynamic, testable theory providing an explicit relationship between the thickness of the wetting film and fluid properties for a blob of one fluid moving in another, with neither phase being gas. In its relationship to the capillary number Ca, the thickness of the film is predicted to be proportional to Ca2 at lower Ca and to level off at a constant value of ˜20% the channel radius at higher Ca. The thickness of the film is deduced to be approximately unaffected by the viscosity ratio of the fluids. We have conducted our own laboratory experiments and compiled experimental data from other studies, all of which are mutually consistent and confirm the salient features of the theory. At the same time, the classic law, originally deduced for films surrounding moving gas bubbles but often believed to hold for liquids as well, fails to explain the observations.

  13. Thickness Influence on In Vitro Biocompatibility of Titanium Nitride Thin Films Synthesized by Pulsed Laser Deposition

    Directory of Open Access Journals (Sweden)

    Liviu Duta

    2016-01-01

    Full Text Available We report a study on the biocompatibility vs. thickness in the case of titanium nitride (TiN films synthesized on 410 medical grade stainless steel substrates by pulsed laser deposition. The films were grown in a nitrogen atmosphere, and their in vitro cytotoxicity was assessed according to ISO 10993-5 [1]. Extensive physical-chemical analyses have been carried out on the deposited structures with various thicknesses in order to explain the differences in biological behavior: profilometry, scanning electron microscopy, atomic force microscopy, X-ray photoelectron spectroscopy (XPS, X-ray diffraction and surface energy measurements. XPS revealed the presence of titanium oxynitride beside TiN in amounts that vary with the film thickness. The cytocompatibility of films seems to be influenced by their TiN surface content. The thinner films seem to be more suitable for medical applications, due to the combined high values of bonding strength and superior cytocompatibility.

  14. A wrinkling-based method for investigating glassy polymer film relaxation as a function of film thickness and temperature

    Science.gov (United States)

    Chung, Jun Young; Douglas, Jack F.; Stafford, Christopher M.

    2017-10-01

    We investigate the relaxation dynamics of thin polymer films at temperatures below the bulk glass transition Tg by first compressing polystyrene films supported on a polydimethylsiloxane substrate to create wrinkling patterns and then observing the slow relaxation of the wrinkled films back to their final equilibrium flat state by small angle light scattering. As with recent relaxation measurements on thin glassy films reported by Fakhraai and co-workers, we find the relaxation time of our wrinkled films to be strongly dependent on film thickness below an onset thickness on the order of 100 nm. By varying the temperature between room temperature and Tg (≈100 °C), we find that the relaxation time follows an Arrhenius-type temperature dependence to a good approximation at all film thicknesses investigated, where both the activation energy and the relaxation time pre-factor depend appreciably on film thickness. The wrinkling relaxation curves tend to cross at a common temperature somewhat below Tg, indicating an entropy-enthalpy compensation relation between the activation free energy parameters. This compensation effect has also been observed recently in simulated supported polymer films in the high temperature Arrhenius relaxation regime rather than the glassy state. In addition, we find that the film stress relaxation function, as well as the height of the wrinkle ridges, follows a stretched exponential time dependence and the short-time effective Young's modulus derived from our modeling decreases sigmoidally with increasing temperature—both characteristic features of glassy materials. The relatively facile nature of the wrinkling-based measurements in comparison to other film relaxation measurements makes our method attractive for practical materials development, as well as fundamental studies of glass formation.

  15. Quantitative characterization of the composition, thickness and orientation of thin films in the analytical electron microscope

    International Nuclear Information System (INIS)

    Williams, D.B.; Watanabe, M.; Papworth, A.J.; Li, J.C.

    2003-01-01

    Compositional variations in thin films can introduce lattice-parameter changes and thus create stresses, in addition to the more usual stresses introduced by substrate-film mismatch, differential thermal expansion, etc. Analytical electron microscopy comprising X-ray energy-dispersive spectrometry within a probe-forming field-emission gun scanning transmission electron microscope (STEM) is one of the most powerful methods of composition measurement on the nanometer scale, essential for thin-film analysis. Recently, with the development of improved X-ray collection efficiencies and quantitative computation methods it has proved possible to map out composition variations in thin films with a spatial resolution approaching 1-2 nm. Because the absorption of X-rays is dependent on the film thickness, concurrent composition and film thickness determination is another advantage of X-ray microanalysis, thus correlating thickness and composition variations, either of which may contribute to stresses in the film. Specific phenomena such as segregation to interfaces and boundaries in the film are ideally suited to analysis by X-ray mapping. This approach also permits multiple boundaries to be examined, giving some statistical certainty to the analysis particularly in nano-crystalline materials with grain sizes greater than the film thickness. Boundary segregation is strongly affected by crystallographic misorientation and it is now possible to map out the orientation between many different grains in the (S)TEM

  16. Vortex kinks in superconducting films with periodically modulated thickness

    International Nuclear Information System (INIS)

    Facio, Jorge I; Abate, Anabella; Guimpel, J; Cornaglia, Pablo S

    2013-01-01

    We report magnetoresistance measurements in Nb films having a periodic thickness modulation. The cylinder shaped thicker regions of the sample, which form a square lattice, act as repulsive centers for the superconducting vortices. For low driving currents along one of the axes of the square lattice, the resistivity ρ increases monotonously with increasing magnetic field B and the ρ–B characteristics are approximately piecewise linear. The linear ρ versus B segments change their slope at matching fields where the number of vortices is an integer or a half integer times the number of protruding cylinders in the sample. Numerical simulations allow us to associate the different segments of linear magnetoresistance to different vortex-flow regimes, some of which are dominated by the propagation of discommensurations (kinks). (paper)

  17. Hydrophobic switching nature of methylcellulose ultra-thin films: thickness and annealing effects

    International Nuclear Information System (INIS)

    Innis-Samson, Vallerie Ann; Sakurai, Kenji

    2011-01-01

    We have studied the thermosensitive property of methylcellulose (MC) thin films supported on Si substrate by static sessile drop contact angle measurements, and their surface properties and thin film structure by x-ray reflectivity (XRR) and atomic force microscopy (AFM) techniques. From the static sessile drop contact angle measurements, the MC thin films showed the characteristic hydrophilic-to-hydrophobic transition at ∼70 0 C, which is the lower critical solution temperature of the bulk solution volume phase separation transition. For films with thickness d ≤ R g , the onset of such a transition is affected by the film thickness while very thick films, d >> R g , yielded higher contact angles. Annealing the MC thin films with thicknesses ∼200 A (near the radius of gyration, R g , of the polymer) below the bulk glass transition temperature (T g ∼ 195 deg. C) would not change the hydrophobic switch nature of the film but annealing 'at' and above the bulk T g would change its surface property. From surface topography images by AFM, there were no significant changes in either the roughness or the film texture before and after annealing. With XRR data, we were able to determine that such changes in the surface properties are highly correlated to the film thickness changes after the annealing process. This study, we believe, is the first to examine the thermal annealing affects on the thermal response function of a thermoresponsive polymer and is important for researching how to tailor the hydrophobic switching property of MC thin films for future sensing applications. (paper)

  18. Angular multiplexing holograms of four images recorded on photopolymer films with recording-film-thickness-dependent holographic characteristics

    Science.gov (United States)

    Osabe, Keiichi; Kawai, Kotaro

    2017-03-01

    In this study, angular multiplexing hologram recording photopolymer films were studied experimentally. The films contained acrylamide as a monomer, eosin Y as a sensitizer, and triethanolamine as a promoter in a polyvinyl alcohol matrix. In order to determine the appropriate thickness of the photopolymer films for angular multiplexing, photopolymer films with thicknesses of 29-503 μm were exposed to two intersecting beams of a YVO laser at a wavelength of 532 nm to form a holographic grating with a spatial frequency of 653 line/mm. The diffraction efficiencies as a function of the incident angle of reconstruction were measured. A narrow angular bandwidth and high diffraction efficiency are required for angular multiplexing; hence, we define the Q value, which is the diffraction efficiency divided by half the bandwidth. The Q value of the films depended on the thickness of the films, and was calculated based on the measured diffraction efficiencies. The Q value of a 297-μm-thick film was the highest of the all films. Therefore, the angular multiplexing experiments were conducted using 300-μm-thick films. In the angular multiplexing experiments, the object beam transmitted by a square aperture was focused by a Fourier transform lens and interfered with a reference beam. The maximum order of angular multiplexing was four. The signal intensity that corresponds to the squared-aperture transmission and the noise intensity that corresponds to transmission without the square aperture were measured. The signal intensities decreased as the order of angular multiplexing increased, and the noise intensities were not dependent on the order of angular multiplexing.

  19. MEMS-based thick film PZT vibrational energy harvester

    DEFF Research Database (Denmark)

    Lei, Anders; Xu, Ruichao; Thyssen, Anders

    2011-01-01

    We present a MEMS-based unimorph silicon/PZT thick film vibrational energy harvester with an integrated proof mass. We have developed a process that allows fabrication of high performance silicon based energy harvesters with a yield higher than 90%. The process comprises a KOH etch using...... a mechanical front side protection of an SOI wafer with screen printed PZT thick film. The fabricated harvester device produces 14.0 μW with an optimal resistive load of 100 kΩ from 1g (g=9.81 m s-2) input acceleration at its resonant frequency of 235 Hz....

  20. Temperature- and thickness-dependent elastic moduli of polymer thin films

    Directory of Open Access Journals (Sweden)

    Ao Zhimin

    2011-01-01

    Full Text Available Abstract The mechanical properties of polymer ultrathin films are usually different from those of their counterparts in bulk. Understanding the effect of thickness on the mechanical properties of these films is crucial for their applications. However, it is a great challenge to measure their elastic modulus experimentally with in situ heating. In this study, a thermodynamic model for temperature- (T and thickness (h-dependent elastic moduli of polymer thin films Ef(T,h is developed with verification by the reported experimental data on polystyrene (PS thin films. For the PS thin films on a passivated substrate, Ef(T,h decreases with the decreasing film thickness, when h is less than 60 nm at ambient temperature. However, the onset thickness (h*, at which thickness Ef(T,h deviates from the bulk value, can be modulated by T. h* becomes larger at higher T because of the depression of the quenching depth, which determines the thickness of the surface layer δ.

  1. Study of lead free ferroelectrics using overlay technique on thick film microstrip ring resonator

    Directory of Open Access Journals (Sweden)

    Shridhar N. Mathad

    2016-03-01

    Full Text Available The lead free ferroelectrics, strontium barium niobates, were synthesized via the low cost solid state reaction method and their fritless thick films were fabricated by screen printing technique on alumina substrate. The X band response (complex permittivity at very high frequencies of Ag thick film microstrip ring resonator perturbed with strontium barium niobates (SrxBa1-xNb2O6 in form of bulk and thick film was measured. A new approach for determination of complex permittivity (ε′ and ε′′ in the frequency range 8–12 GHz, using perturbation of Ag thick film microstrip ring resonator (MSRR, was applied for both bulk and thick film of strontium barium niobates (SrxBa1-xNb2O6. The microwave conductivity of the bulk and thick film lie in the range from 1.779 S/cm to 2.874 S/cm and 1.364 S/cm to 2.296 S/cm, respectively. The penetration depth of microwave in strontium barium niobates is also reported.

  2. Thickness Effect on Properties of Sprayed In2S3 Films for Photovoltaic Applications

    Science.gov (United States)

    Bouguila, N.; Kraini, M.; Halidou, I.; Lacaze, E.; Bouchriha, H.; Bouzouita, H.

    2016-01-01

    Indium sulfide (In2S3) films have been deposited on soda-lime glass substrates using a spray technique (CSP). Indium chloride and thiourea were used as precursors at a molar ratio of S:In = 2. The substrate temperature was fixed at 340°C. The effect of film thickness on the structural, morphological and optical properties of the as-deposited films has been studied. These films were characterized by x-ray diffraction, scanning electron microscopy (SEM), atomic force microscopy (AFM) and optical absorption spectroscopy. As-prepared samples were polycrystalline with a cubic structure and (400) as preferential orientation. Their grain size increased from 35 nm to 41 nm with increasing thickness whereas the dislocation density and microstrain of the films decreased with the increase of thickness. Both SEM and AFM images showed that the films were homogenous with an increase of the surface roughness with the increase of thickness. The optical transmittance of the films decreased from 80% to 20% in the visible and infrared regions when the thickness was increased from 0.78 μm to 6.09 μm. The optical band gap E g was found to be in the range of 2.75-2.19 eV and showed a decrease with film thickness. Based on the measured optical constants (n and k), a Wemple-Didomenico model was used to determine the values of single oscillator energy ( E 0), dispersion energy ( E d), optical band gap ( E g) and high frequency dielectric constant ( \\varepsilon_{∞} ). In addition, these films exhibited n-type conductivity and were highly resistive. These results confirm that In2S3 thin films are a promising alternative as a buffer-layer material for CuInGa(S,Se)2-based solar cells.

  3. Electroplated thick-film cobalt platinum permanent magnets

    Energy Technology Data Exchange (ETDEWEB)

    Oniku, Ololade D.; Qi, Bin; Arnold, David P., E-mail: darnold@ufl.edu

    2016-10-15

    The material and magnetic properties of multi-micron-thick (up to 6 μm) L1{sub 0} CoPt magnetic films electroplated onto silicon substrates are investigated as candidate materials for integration in silicon-based microsystems. The influence of various process conditions on the structure and magnetic properties of electroplated CoPt thick-films is studied in order to better understand the complex process/structure/property relationships associated with the electroplated films. Process variables studied here include different seed layers, electroplating current densities (ranging from 25–200 mA/cm{sup 2}), deposition times (up to 60 min), and post-deposition annealing times and temperatures. Analyses include film morphology, film thickness, composition, surface roughness, grain size, phase volume fractions, and L1{sub 0} ordering parameter. Key correlations are found relating process and structure variations to the extrinsic magnetic properties (remanence, coercivity, squareness, and energy product). Strong hard magnetic properties (B{sub r} ~0.8 T, H{sub ci} ~800 kA/m, squareness close to 0.9, and BH{sub max} of 100 kJ/m{sup 3}) are obtained for films deposited on Si/TiN/Ti/Cu at current densities of 100 mA/cm{sup 2}, pH of 7, and subsequently annealed at 675 °C for 30 min. - Highlights: • CoPt films plated up to 6 μm thick on silicon substrates. • A1 to L1{sub 0} phase transformation by annealing in forming gas. • Various process–structure–property relationships explored. • Key results: B{sub r} ~0.8 T, H{sub ci} ~800 kA/m, squareness 0.9, and BH{sub max} ~100 kJ/m{sup 3}.

  4. Skin Friction Measurements Using Luminescent Oil Films

    Science.gov (United States)

    Husen, Nicholas M.

    As aircraft are designed to a greater extent on computers, the need for accurate and fast CFD algorithms has never been greater. The development of CFD algorithms requires experimental data against which CFD output can be validated and from which insight about flow physics can be acquired. Skin friction, in particular, is an important quantity to predict with CFD, and experimental skin friction data sets aid not only with the validation of the CFD predictions, but also in tuning the CFD models to predict specific flow fields. However, a practical experimental technique for collecting spatially and temporally resolved skin friction data on complex models does not yet exist. This dissertation develops and demonstrates a new luminescent oil film skin friction meter which can produce spatially-resolved quantitative steady and unsteady skin friction data on models with complex curvature. The skin friction acting on the surface of a thin film of oil can be approximated by the expression tauw =mu ouh/h, where mu o is the dynamic viscosity of the oil, uh is the velocity of the surface of the oil film, and h is the thickness of the oil film. The new skin friction meter determines skin friction by measuring h and uh. The oil film thickness h is determined by ratioing the intensity of the fluorescent emissions from the oil film with the intensity of the incident light which is scattered from the surface of the model. When properly calibrated, that ratio provides an absolute oil film thickness value. This oil film thickness meter is therefore referred as the Ratioed-Image Film-Thickness (RIFT) Meter. The oil film velocity uh is determined by monitoring the evolution of tagged molecules within the oil film: Photochromic molecules are dissolved into the fluorescent oil and a pattern is written into the oil film using an ultraviolet laser. The evolution of the pattern is recorded, and standard cross-correlation techniques are applied to the resulting sequence of images. This

  5. Relaxation in Thin Polymer Films Mapped across the Film Thickness by Astigmatic Single-Molecule Imaging

    KAUST Repository

    Oba, Tatsuya

    2012-06-19

    We have studied relaxation processes in thin supported films of poly(methyl acrylate) at the temperature corresponding to 13 K above the glass transition by monitoring the reorientation of single perylenediimide molecules doped into the films. The axial position of the dye molecules across the thickness of the film was determined with a resolution of 12 nm by analyzing astigmatic fluorescence images. The average relaxation times of the rotating molecules do not depend on the overall thickness of the film between 20 and 110 nm. The relaxation times also do not show any dependence on the axial position within the films for the film thickness between 70 and 110 nm. In addition to the rotating molecules we observed a fraction of spatially diffusing molecules and completely immobile molecules. These molecules indicate the presence of thin (<5 nm) high-mobility surface layer and low-mobility layer at the interface with the substrate. (Figure presented) © 2012 American Chemical Society.

  6. A sensitive magnetic field sensor using BPSCCO thick film

    Indian Academy of Sciences (India)

    Unknown

    Abstract. A highly sensitive magnetic sensor operating at liquid nitrogen temperature and based on BPSCCO screen-printed thick film, is reported. The sensor resistance for an applied magnetic field of 100 × 10–4 T. (100 gauss) exhibits an increase by 360% of its value in zero field at 77⋅4 K. The performance of the sensor ...

  7. Shearing Nanometer-Thick Confined Hydrocarbon Films: Friction and Adhesion

    DEFF Research Database (Denmark)

    Sivebæk, I. M.; Persson, B. N. J.

    2016-01-01

    We present molecular dynamics (MD) friction and adhesion calculations for nanometer-thick confined hydrocarbon films with molecular lengths 20, 100 and 1400 carbon atoms. We study the dependency of the frictional shear stress on the confining pressure and sliding speed. We present results...

  8. MEMS Accelerometer with Screen Printed Piezoelectric Thick Film

    DEFF Research Database (Denmark)

    Hindrichsen, Christian Carstensen; Lau-Moeller, R.; Bove, T.

    2006-01-01

    A bulk-micromachined piezoelectric MEMS accelerometer with screen printed piezoelectric Pb(ZrxTil )O3(PZT) thick film (TF) as the sensing material has been fabricated and characterized. The accelerometer has a four beam structure with a central seismic mass (3600x3600x500 pm3) and a total chip size...

  9. Polymer Thick-Film Sensors: Possibilities for Smartcard Biometrics

    NARCIS (Netherlands)

    Henderson, N.J.; Papakostas, T.V.; White, N.M.; Hartel, Pieter H.

    In this paper the potential of polymer thick-film sensors are assessed for use as biometric sensors on smartcards. Piezoelectric and piezoresistive sensors have been printed on flexible polyester, then bonded to smartcard blanks. The tactile interaction of a person with these sensors has been

  10. A sensitive magnetic field sensor using BPSCCO thick film

    Indian Academy of Sciences (India)

    A highly sensitive magnetic sensor operating at liquid nitrogen temperature and based on BPSCCO screen-printed thick film, is reported. The sensor resistance for an applied magnetic field of 100 × 10–4T(100 gauss) exhibits an increase by 360% of its value in zero field at 77.4 K. The performance of the sensor in presence ...

  11. Effects of thickness on electronic structure of titanium thin films

    Indian Academy of Sciences (India)

    Effects of thickness on the electronic structure of e-beam evaporated thin titanium films were studied using near-edge X-ray absorption ... become a powerful experimental technique to get electronic structural information of elements or .... the Stanford Synchrotron Radiation Laboratory (SSRL). The beamline 8·2 is a bending ...

  12. In-situ and elementally resolved determination of the thickness uniformity of multi-ply films by confocal micro XRF.

    Science.gov (United States)

    Peng, Song; Liu, Zhiguo; Sun, Tianxi; Wang, Guangfu; Ma, Yongzhong; Ding, Xunliang

    2014-08-01

    Confocal micro X-ray fluorescence (CM-XRF) with quasi-monochromatic excitation based on polycapillary X-ray optics was used to measure the thickness of multi-ply films. The relative errors of measuring an Fe film with a thickness of 16.3 μm and a Cu film with a thickness of 24.5 μm were 7.3% and 0.4%, respectively. The non-destructive and in-situ measurement of the thickness and uniformity of multi-ply films of Cu, Fe and Ni on a silicon surface was performed. CM-XRF was convenient in in-situ and elementally resolved analysis of the thickness of multi-ply films without a cumbersome theoretical correction model. Copyright © 2014 Elsevier Ltd. All rights reserved.

  13. Card controlled beta backscatter thickness measuring instrument

    International Nuclear Information System (INIS)

    Schlesinger, J.

    1978-01-01

    An improved beta backscatter instrument for the nondestructive measurement of the thickness of thin coatings on a substrate is described. Included therein is the utilization of a bank of memory stored data representative of isotope, substrate, coating material and thickness range characteristics in association with a control card having predetermined indicia thereon selectively representative of a particular isotope, substrate material, coating material and thickness range for conditioning electronic circuit means by memory stored data selected in accord with the predetermined indicia on a control card for converting backscattered beta particle counts into indicia of coating thickness

  14. Elaboration of PZT thick films by screen printing

    Science.gov (United States)

    Tajan, V.; Gonnard, Paul; Troccaz, M.

    1996-04-01

    This study concerns the fabrication of a `soft' lead zirconate titanate (PZT) thick films on a Platinum substrate (5 X 15 mm size, 0.25 mm thickness) by the screen printing method. Various parameters connected with the screen printing (rheological characteristic of the ink, firing conditions of the layer) as well as those concerning the active powder used (grain size, grain distribution) are studied. The screen printed specimens characterized from their dielectric properties and their hysteresis loop show a diminution compared to the bulk ceramic, which may be attributed to the less than completely densified films. A study of the displacement versus an a.c. electric field of the piezoelectric film on a platinum substrate is also achieved by a laser doppler vibrometry technique. A comparison with a machined down ceramic pasted on this same Pt substrate is carried out.

  15. Film-thickness dependence of structure formation in ultra-thin polymer blend films

    CERN Document Server

    Gutmann, J S; Stamm, M

    2002-01-01

    We investigated the film-thickness dependence of structure formation in ultra-thin polymer blend films prepared from solution. As a model system we used binary blends of statistical poly(styrene-co-p-bromostyrene) copolymers of different degrees of bromination. Ultra-thin-film samples differing in miscibility and film thickness were prepared via spin coating of common toluene solutions onto silicon (100) substrates. The resulting morphologies were investigated with scanning force microscopy, reflectometry and grazing-incidence scattering techniques using both X-rays and neutrons in order to obtain a picture of the sample structure at and below the sample surface. (orig.)

  16. Ceramic thick film humidity sensor based on MgTiO3 + LiF

    International Nuclear Information System (INIS)

    Kassas, Ahmad; Bernard, Jérôme; Lelièvre, Céline; Besq, Anthony; Guhel, Yannick; Houivet, David; Boudart, Bertrand; Lakiss, Hassan; Hamieh, Tayssir

    2013-01-01

    Graphical abstract: - Highlights: • The fabricated sensor based on MgTiO 3 + LiF materials used the spin coating technology. • The response time is 70 s to detect variation between 5 and 95% relative humidity. • The addition of Scleroglucan controls the viscosity and decreases the roughness of thick film surface. • This humidity sensor is a promising, low-cost, high-quality, reliable ceramic films, that is highly sensitive to humidity. - Abstract: The feasibility of humidity sensor, consisting of a thick layer of MgTiO 3 /LiF materials on alumina substrate, was studied. The thermal analysis TGA-DTGA and dilatometric analysis worked out to confirm the sintering temperature. An experimental plan was applied to describe the effects of different parameters in the development of the thick film sensor. Structural and microstructural characterizations of the developed thick film were made. Rheological study with different amounts of a thickener (scleroglucan “sclg”), showing the behavior variation, as a function of sclg weight % was illustrated and rapprochement with the results of thickness variation as a function of angular velocity applied in the spin coater. The electrical and dielectric measurements confirmed the sensitivity of the elaborated thick film against moisture, along with low response time

  17. Ceramic thick film humidity sensor based on MgTiO{sub 3} + LiF

    Energy Technology Data Exchange (ETDEWEB)

    Kassas, Ahmad, E-mail: a.kassas.mcema@ul.edu.lb [Faculty of Agricultural Engineering and Veterinary Medicine, Laboratory of Materials, Catalysis, Environment and Analytical Methods (MCEMA), Faculty of Sciences and Doctoral School of Sciences and Technology (EDST), Lebanese University, Hariri Campus, Hadath, Beirut (Lebanon); Laboratoire Universitaire des Sciences Appliquées de Cherbourg (LUSAC), 50130 Cherbourg-Octeville (France); Bernard, Jérôme; Lelièvre, Céline; Besq, Anthony; Guhel, Yannick; Houivet, David; Boudart, Bertrand [Laboratoire Universitaire des Sciences Appliquées de Cherbourg (LUSAC), 50130 Cherbourg-Octeville (France); Lakiss, Hassan [Faculty of Agricultural Engineering and Veterinary Medicine, Laboratory of Materials, Catalysis, Environment and Analytical Methods (MCEMA), Faculty of Sciences and Doctoral School of Sciences and Technology (EDST), Lebanese University, Hariri Campus, Hadath, Beirut (Lebanon); Faculty of Engineering, Section III, Hariri Campus, Hadath, Beirut (Lebanon); Hamieh, Tayssir [Faculty of Agricultural Engineering and Veterinary Medicine, Laboratory of Materials, Catalysis, Environment and Analytical Methods (MCEMA), Faculty of Sciences and Doctoral School of Sciences and Technology (EDST), Lebanese University, Hariri Campus, Hadath, Beirut (Lebanon)

    2013-10-15

    Graphical abstract: - Highlights: • The fabricated sensor based on MgTiO{sub 3} + LiF materials used the spin coating technology. • The response time is 70 s to detect variation between 5 and 95% relative humidity. • The addition of Scleroglucan controls the viscosity and decreases the roughness of thick film surface. • This humidity sensor is a promising, low-cost, high-quality, reliable ceramic films, that is highly sensitive to humidity. - Abstract: The feasibility of humidity sensor, consisting of a thick layer of MgTiO{sub 3}/LiF materials on alumina substrate, was studied. The thermal analysis TGA-DTGA and dilatometric analysis worked out to confirm the sintering temperature. An experimental plan was applied to describe the effects of different parameters in the development of the thick film sensor. Structural and microstructural characterizations of the developed thick film were made. Rheological study with different amounts of a thickener (scleroglucan “sclg”), showing the behavior variation, as a function of sclg weight % was illustrated and rapprochement with the results of thickness variation as a function of angular velocity applied in the spin coater. The electrical and dielectric measurements confirmed the sensitivity of the elaborated thick film against moisture, along with low response time.

  18. Thickness dependence of Hall mobility of HWE grown PbTe films

    International Nuclear Information System (INIS)

    Vaya, P.R.; Majhi, J.; Gopalam, B.S.V.; Dattatreyan, C.

    1985-01-01

    Thin epitaxial n-PbTe films of various thicknesses are grown on KCl substrates by hot wall epitaxy (HWE) technique. The X-ray, SEM and TEM studies of these films revealed their single crystalline nature. The Hall mobility (μ/sub H/) of these films is measured by Van der Pauw technique and compared with the numerically calculated values of PbTe. It is observed that μ/sub H/ very strongly depends on thickness for thin films but becomes independent of film thickness beyond 5 μm approaching its bulk value. The constant value of Hall coefficient in the temperature range 77 to 300 K show the extrinsic nature of these films. It is also noticed that the rate of increase of mobility with decreasing temperature becomes higher with film thickness. The diffused scattering mobility due to the size effect is calculated and compared with experimental data. A large discrepancy observed between these two is explained on the basis of the residual mobility contribution. The residual mobility is attributed to overall scattering due to grain boundaries, dislocations, defects, cleavage steps, and other surface effects. (author)

  19. Influence of substrate and film thickness on polymer LIPSS formation

    Energy Technology Data Exchange (ETDEWEB)

    Cui, Jing; Nogales, Aurora; Ezquerra, Tiberio A. [Instituto de Estructura de la Materia (IEM-CSIC), Serrano 121, Madrid 28006 (Spain); Rebollar, Esther, E-mail: e.rebollar@csic.es [Instituto de Química Física Rocasolano (IQFR-CSIC), Serrano 119, Madrid 28006 (Spain)

    2017-02-01

    Highlights: • The estimation of temperature upon pulse accumulation shows that a small positive offset is caused by each individual pulse. • Number of pulses needed for LIPSS formation in PS thin films depends on polymer thickness. • Thermal conductivity and diffusivity of supporting substrate influence the onset for LIPSS formation and their quality. • Quality of LIPSS is affected by the substrate optical properties. - Abstract: Here we focus on the influence of both, substrate and film thickness on polymer Laser Induced Periodic Surface Structures (LIPSS) formation in polymer films. For this aim a morphological description of ripples structures generated on spin-coated polystyrene (PS) films by a linearly polarized laser beam with a wavelength of 266 nm is presented. The influence of different parameters on the quality and characteristics of the formed laser-induced periodic surface structures (LIPSS) was investigated. We found that well-ordered LIPSS are formed either on PS films thinner than 200 nm or thicker than 400 nm supported on silicon substrates as well as on thicker free standing films. However less-ordered ripples are formed on silicon supported films with intermediate thicknesses in the range of 200–380 nm. The effect of the thermal and optical properties of the substrate on the quality of LIPSS was analyzed. Differences observed in the fluence and number of pulses needed for the onset of surface morphological modifications is explained considering two main effects which are: (1) The temperature increase on polymer surface induced by the action of cumulative laser irradiation and (2) The differences in thermal conductivity between the polymer and the substrate which strongly affect the heat dissipation generated by irradiation.

  20. Flat Type Thick Film Inductive Sensors

    Directory of Open Access Journals (Sweden)

    D. Marioli

    2003-01-01

    area. Moreover, two sensors have been tested in the laboratory using the single layer as a distance sensor and the multi-layer as a transducer for the measurement of a metallic object profile. The results of the tests show a maximum sensitivity of 14mV/µm and a resolution of 0.6 µm for the single layer, while the multi layer one reconstructs the profile with an axial resolution of a few microns and a lateral resolution better than 200 mm.

  1. Greenland Radar Ice Sheet Thickness Measurements

    Data.gov (United States)

    National Aeronautics and Space Administration — Two 150-MHz coherent radar depth sounders were developed and flown over the Greenland ice sheet to obtain ice thickness measurements in support of PARCA...

  2. Model SH intelligent instrument for thickness measuring

    International Nuclear Information System (INIS)

    Liu Juntao; Jia Weizhuang; Zhao Yunlong

    1995-01-01

    The authors introduce Model SH Intelligent Instrument for thickness measuring by using principle of beta back-scattering and its application range, features, principle of operation, system design, calibration and specifications

  3. Thickness and structure of the water film deposited from vapour on calcite surfaces

    DEFF Research Database (Denmark)

    Bohr, Jakob; Wogelius, Roy A.; Morris, Peter M.

    2010-01-01

    Synchrotron X-ray reflectivity (SXR) was used to measure the thickness of the water film that adsorbs on a {10¯14} cleavage surface of calcite (CaCO3) in a sample chamber where relative humidity could be controlled within the range from......Synchrotron X-ray reflectivity (SXR) was used to measure the thickness of the water film that adsorbs on a {10¯14} cleavage surface of calcite (CaCO3) in a sample chamber where relative humidity could be controlled within the range from...

  4. Fabrication and Characterization of PZT Thick Films for Sensing and Actuation

    Directory of Open Access Journals (Sweden)

    Kuo-Ching Kuo

    2007-04-01

    Full Text Available Lead Zirconate Titanate oxide (PZT thick films with thicknesses of up to 10 μmwere developed using a modified sol-gel technique. Usually, the film thickness is less than1 μm by conventional sol-gel processing, while the electrical charge accumulation whichreveals the direct effect of piezoelectricity is proportional to the film thickness and thereforerestricted. Two approaches were adopted to conventional sol-gel processing – precursorconcentration modulation and rapid thermal annealing. A 10 μm thick film was successfullyfabricated by coating 16 times via this technique. The thickness of each coating layer wasabout 0.6 μm and the morphology of the film was dense with a crack-free area as large as 16mm2. In addition, the structure, surface morphology and physical properties werecharacterized by X-ray diffraction (XRD, scanning electron microscopy (SEM and atomicforce microscopy (AFM and electrical performance. The dielectric constant and hysteresisloops were measured as electric characteristics. This study investigates the actuation andsensing performance of the vibrating structures with the piezoelectric thick film. Theactuation tests demonstrated that a 4 mm x 4 mm x 6.5 μm PZT film drove a 40 mm x 7 mmx 0.5 mm silicon beam as an actuator. Additionally, it generated an electrical signal of 60mVpp as a sensor, while vibration was input by a shaker. The frequencies of the first twomodes of the beam were compared with the theoretical values obtained by Euler-Bernoullibeam theory. The linearity of the actuation and sensing tests were also examined.

  5. Influence of cement film thickness on the retention of implant-retained crowns.

    Science.gov (United States)

    Mehl, Christian; Harder, Sönke; Steiner, Martin; Vollrath, Oliver; Kern, Matthias

    2013-12-01

    The main goal of this study was to establish a new, high precision procedure to evaluate the influence of cement film thickness on the retention of cemented implant-retained crowns. Ninety-six tapered titanium abutments (6° taper, 4.3 mm diameter, Camlog) were shortened to 4 mm. Computer-aided design was used to design the crowns, and selective laser sintering, using a cobalt-chromium alloy, was used to produce the crowns. This method used a focused high-energy laser beam to fuse a localized region of metal powder to build up the crowns gradually. Before cementing, preset cement film thicknesses of 15, 50, 80, or 110 μm were established. Glass ionomer, polycarboxylate, or resin cements were used for cementation. After 3 days storage in demineralized water, the retention of the crowns was measured in tension using a universal testing machine. The cement film thicknesses could be achieved with a high level of precision. Interactions between the factors cement and cement film thickness could be found (p ≤ 0.001). For all cements, crown retention decreased significantly between a cement film thickness of 15 and 50 μm (p ≤ 0.001). At 15 μm cement film thickness, the resin cement was the most retentive cement, followed by the polycarboxylate and then the glass ionomer cement (p ≤ 0.05). The results suggest that cement film thickness has an influence on the retentive strength of cemented implant-retained crowns. © 2013 by the American College of Prosthodontists.

  6. Thickness effect on properties of titanium film deposited by d.c. ...

    Indian Academy of Sciences (India)

    of film thickness (Standard ASTME 92 1986) in order to minimize the effect of substrate on hardness of the film. However, in the present work, the indenter penetration depth was always more than the film thickness. The film hard- ness was separated from the composite hardness of the film- substrate system by the use of an ...

  7. Thickness dependent structural, optical and electrical properties of Se85In12Bi3 nanochalcogenide thin films

    Science.gov (United States)

    Tripathi, Ravi P.; Zulfequar, M.; Khan, Shamshad A.

    2018-04-01

    Our aim is to study the thickness dependent effects on structure, electrical and optical properties of Se85In12Bi3 nanochalcogenide thin films. Bulk alloy of Se85In12Bi3 was synthesized by melt-quenching technique. The amorphous as well as glassy nature of Se85In12Bi3 chalcogenide was confirmed by non-isothermal Differential Scanning Calorimetry (DSC) measurements. The nanochalcogenide thin films of thickness 30, 60 and 90 nm were prepared on glass/Si wafer substrate using Physical Vapour Condensation Technique (PVCT). From XRD studies it was found that thin films have amorphous texture. The surface morphology and particle size of films were studied by Field Emission Scanning Electron Microscope (FESEM). From optical studies, different optical parameters were estimated for Se85In12Bi3 thin films at different thickness. It was found that the absorption coefficient (α) and extinction coefficient (k) increases with photon energy and decreases with film thickness. The optical absorption process followed the rule of indirect transitions and optical band gap were found to be increase with film thickness. The value of Urbach energy (Et) and steepness parameter (σ) were also calculated for different film thickness. For electrical studies, dc-conductivity measurement was done at different temperature and activation energy (ΔEc) were determined and found to be increase with film thickness.

  8. Effect of cell thickness on the electrical and optical properties of thin film silicon solar cell

    Science.gov (United States)

    Zaki, A. A.; El-Amin, A. A.

    2017-12-01

    In this work Electrical and optical properties of silicon thin films with different thickness were measured. The thickness of the Si films varied from 100 to 800 μm. The optical properties of the cell were studied at different thickness. A maximum achievable current density (MACD) generated by a planar solar cell, was measured for different values of the cell thickness which was performed by using photovoltaic (PV) optics method. It was found that reducing the values of the cell thickness improves the open-circuit voltage (VOC) and the fill factor (FF) of the solar cell. The optical properties were measured for thin film Si (TF-Si) at different thickness by using the double beam UV-vis-NIR spectrophotometer in the wavelength range of 300-2000 nm. Some of optical parameters such as refractive index with dispersion relation, the dispersion energy, the oscillator energy, optical band gap energy were calculated by using the spectra for the TF-Si with different thickness.

  9. Wide band interferometry for thickness measurement

    Science.gov (United States)

    Costantino, Santiago; Martinez, Oscar E.; Torga, Jorge R.

    2003-04-01

    In this work we present the concept of wide band interferometry as opposed to white-light interferometry to introduce a thickness measurement method that gains precision when the bandwidth is reduced to an adequate compromise in order to avoid the distortions arising from the material dispersion. The use of the widest possible band is a well established dogma when the highest resolution is desired in distance measurements with white-light interferometry. We will show that the dogma falls when thickness measurements must be carried out due to material dispersion. In fact the precise knowledge of the frequency dependence of the refractive index is essential for adequate thickness retrieval from the optical experiments. The device we present is also useful to obtain the group refractive index that is necessary to calculate the absolute thickness value. As an example, we show the spreading of a silicone oil on a reference surface in real time.

  10. Chemical vapor deposition reactor. [providing uniform film thickness

    Science.gov (United States)

    Chern, S. S.; Maserjian, J. (Inventor)

    1977-01-01

    An improved chemical vapor deposition reactor is characterized by a vapor deposition chamber configured to substantially eliminate non-uniformities in films deposited on substrates by control of gas flow and removing gas phase reaction materials from the chamber. Uniformity in the thickness of films is produced by having reactive gases injected through multiple jets which are placed at uniformally distributed locations. Gas phase reaction materials are removed through an exhaust chimney which is positioned above the centrally located, heated pad or platform on which substrates are placed. A baffle is situated above the heated platform below the mouth of the chimney to prevent downdraft dispersion and scattering of gas phase reactant materials.

  11. Uncertainty estimation of ultrasonic thickness measurement

    International Nuclear Information System (INIS)

    Yassir Yassen, Abdul Razak Daud; Mohammad Pauzi Ismail; Abdul Aziz Jemain

    2009-01-01

    The most important factor that should be taken into consideration when selecting ultrasonic thickness measurement technique is its reliability. Only when the uncertainty of a measurement results is known, it may be judged if the result is adequate for intended purpose. The objective of this study is to model the ultrasonic thickness measurement function, to identify the most contributing input uncertainty components, and to estimate the uncertainty of the ultrasonic thickness measurement results. We assumed that there are five error sources significantly contribute to the final error, these sources are calibration velocity, transit time, zero offset, measurement repeatability and resolution, by applying the propagation of uncertainty law to the model function, a combined uncertainty of the ultrasonic thickness measurement was obtained. In this study the modeling function of ultrasonic thickness measurement was derived. By using this model the estimation of the uncertainty of the final output result was found to be reliable. It was also found that the most contributing input uncertainty components are calibration velocity, transit time linearity and zero offset. (author)

  12. Advantages of PZT thick film for MEMS sensors

    DEFF Research Database (Denmark)

    Hindrichsen, Christian Carstensen; Lou-Moller, R.; Hansen, K.

    2010-01-01

    For all MEMS devices a high coupling between the mechanical and electrical domain is desired. Figures of merit describing the coupling are important for comparing different piezoelectric materials. The existing figures of merit are discussed and a new figure of merit is introduced for a fair...... comparison of piezoelectric thin and thick films based MEMS devices, as cantilevers, beams, bridges and membranes. Simple analytical modeling is used to define the new figure of merit. The relevant figure of merits is compared for the piezoelectric material of interest for MEMS applications: ZnO, AIN, PZT....... Improved figure of merit is reached in the piezoelectric PZT thick film, TF2100CIP, by using cold isostatic pressure in the PZT preparation process. The porosity of TF2100 is decreased 38%, hence, allowing an increase of charge sensitivity for MEMS sensors of 59%....

  13. Indium-Nitrogen Codoped Zinc Oxide Thin Film Deposited by Ultrasonic Spray Pyrolysis on n-(111 Si Substrate: The Effect of Film Thickness

    Directory of Open Access Journals (Sweden)

    Cheng-Chang Yu

    2014-01-01

    Full Text Available Indium-nitrogen codoped zinc oxide (INZO thin films were fabricated by spray pyrolysis deposition technique on n-(111 Si substrate with different film thicknesses at 450°C using a precursor containing zinc acetate, ammonium acetate, and indium nitrate with 1 : 3 : 0.05 at.% concentration. The morphology and structure studies were carried out by scanning electron microscopy (SEM and X-ray diffraction (XRD. The grain size of the films increased when increasing the film thickness. From XRD spectra, polycrystalline ZnO structure can be observed and the preferred orientation behavior varied from (002 to (101 as the film thickness increased. The concentration and mobility were investigated by Hall effect measurement. the p-type films with a hole mobility around 3 cm2V−1s−1 and hole concentration around 3×1019 cm−3 can be achieved with film thickness less than 385 nm. The n-type conduction with concentration 1×1020 cm−3 is observed for film with thickness 1089 nm. The defect states were characterized by photoluminescence. With temperature-dependent conductivity analysis, acceptor state with activation energy 0.139 eV dominate the p type conduction for thin INZO film. And the Zn-related shallow donors with activation energy 0.029 eV dominate the n-type conduction for the thick INZO film.

  14. Thickness-Dependent Surfactant Behavior in Trilayer Polymer Films

    Science.gov (United States)

    Sun, Yan; Shull, Kenneth; Wang, Jin

    2010-03-01

    The ability for thin liquid films to wet and remain thermodynamically stable on top of one another is a fundamental challenge in developing high quality paints, coatings, adhesives, and other industrial products. Since intermolecular interactions and interfacial energies dominate in the film thickness regime from tens to hundreds of nanometers, it is desirable to tune these long-range and short-range forces in a simple, controllable manner. Starting from an unstable model homopolymer bilayer (poly(styrene)/poly(4-vinylpyridine)), we demonstrate that sandwiching an additional homopolymer layer (poly(4-bromostyrene)) between the two layers can provide needed surfactancy. As the thickness of this center layer is increased, the full trilayer transitions from unstable (thin) to stable (moderate) to unstable (thick). We experimentally show using x-ray standing waves generated via total external reflection (TER-XSW), atomic force microscopy (AFM), and time-of-flight secondary ion mass spectroscopy (ToF-SIMS) that this behavior can be directly attributed to the autophobic dewetting phenomenon, in which the surfactant layer is thin enough to remain stable but thick enough to shield the neighboring layers, highlighting a general approach to stabilizing multilayer systems.

  15. Dielectric response of fully and partially depleted ferroelectric thin films and inversion of the thickness effect

    International Nuclear Information System (INIS)

    Misirlioglu, I B; Yildiz, M

    2013-01-01

    We study the effect of full and partial depletion on the dielectric response characteristics of ferroelectric thin films with impurities via a computational approach. Using a thermodynamic approach along with the fundamental equations for semiconductors, we show that films with partial depletion display unique features and an enhanced dielectric response compared with those fully depleted. We find that the capacitance peak at switching can be significantly suppressed in the case of high impurity densities (>10 25 m −3 ) with relatively low ionization energy, of the order of 0.5 eV. For conserved number of species in films, electromigration of ionized impurities at room temperature is negligible and has nearly no effect on the dielectric response. In films with high impurity density, the dielectric response at zero bias is enhanced with respect to charge-free films or those with relatively low impurity density ( 24 m −3 ). We demonstrate that partially depleted films should be expected to exhibit peculiar capacitance–voltage characteristics at low and high bias and that the thickness effect probed in experiments in ferroelectric thin films could be entirely inverted in thin films with depletion charges where a higher dielectric response can be measured in thicker films. Therefore, depletion charge densities in ferroelectric thin films should be estimated before size-effect-related studies. Finally, we noted that these findings are in good qualitative agreement with dielectric measurements carried out on PbZr x Ti 1−x O 3 . (paper)

  16. Gas sensing properties of Cu and Cr activated BST thick films

    Indian Academy of Sciences (India)

    H2S gas sensing properties of BST ((Ba0.67Sr0.33)TiO3) thick films are reported here for the first time. BST ceramic powder was prepared by mechanochemical ... of activators on H2S gas sensing were discussed. The sensitivity, selectivity, stability, response and recovery time of the sensor were measured and presented.

  17. Ethanol gas sensing properties of Al2 O3-doped ZnO thick film ...

    Indian Academy of Sciences (India)

    The characterization and ethanol gas sensing properties of pure and doped ZnO thick films were investigated. Thick films of pure zinc oxide were prepared by the screen printing technique. Pure zinc oxide was almost insensitive to ethanol. Thick films of Al2O3 (1 wt%) doped ZnO were observed to be highly sensitive to ...

  18. Full-field optical thickness profilometry of semitransparent thin films with transmission densitometry

    Energy Technology Data Exchange (ETDEWEB)

    Johnson, Jay; Harris, Tequila

    2010-05-20

    A novel bidirectional thickness profilometer based on transmission densitometry was designed to measure the localized thickness of semitransparent films on a dynamic manufacturing line. The densitometer model shows that, for materials with extinction coefficients between 0.3 and 2.9 D/mm, 100-500 {mu}m measurements can be recorded with less than {+-}5% error at more than 10,000 locations in real time. As a demonstration application, the thickness profiles of 75 mmx100 mm regions of polymer electrolyte membrane (PEM) were determined by converting the optical density of the sample to thickness with the Beer-Lambert law. The PEM extinction coefficient was determined to be 1.4 D/mm, with an average thickness error of 4.7%.

  19. Method of accurate thickness measurement of boron carbide coating on copper foil

    Science.gov (United States)

    Lacy, Jeffrey L.; Regmi, Murari

    2017-11-07

    A method is disclosed of measuring the thickness of a thin coating on a substrate comprising dissolving the coating and substrate in a reagent and using the post-dissolution concentration of the coating in the reagent to calculate an effective thickness of the coating. The preferred method includes measuring non-conducting films on flexible and rough substrates, but other kinds of thin films can be measure by matching a reliable film-substrate dissolution technique. One preferred method includes determining the thickness of Boron Carbide films deposited on copper foil. The preferred method uses a standard technique known as inductively coupled plasma optical emission spectroscopy (ICPOES) to measure boron concentration in a liquid sample prepared by dissolving boron carbide films and the Copper substrates, preferably using a chemical etch known as ceric ammonium nitrate (CAN). Measured boron concentration values can then be calculated.

  20. Gas Sensing Properties of Pure and Cr Activated WO3 Thick Film Resistors

    Directory of Open Access Journals (Sweden)

    V. B. GAIKWAD

    2010-09-01

    Full Text Available Thick films of WO3 (Tungsten Oxide were prepared by screen-printing techniques. The surfaces of the films were modified by dipping them into an aqueous solution of Chromium Oxide (CrO3 for different intervals of time, followed by firing at 550 oC for 30 min. The gas sensing performance of the pure and Cr2O3-modified films was tested for various gases at different temperatures. The unmodified films showed response to H2S, ethanol and cigar smoke. However Cr2O3- modified films suppresses gas sensing response to all gases except H2S. The surface modification, using dipping process, altered the adsorbate-adsorbent interactions, which gave the specific selectivity and enhanced sensitivity to H2S gas. The gas response, selectivity, thermal stability and recovery time of the sensor were measured and presented. The role played by surface chromium species to improve gas sensing performance is discussed.

  1. Formation process of graphite film on Ni substrate with improved thickness uniformity through precipitation control

    Science.gov (United States)

    Kim, Seul-Gi; Hu, Qicheng; Nam, Ki-Bong; Kim, Mun Ja; Yoo, Ji-Beom

    2018-04-01

    Large-scale graphitic thin film with high thickness uniformity needs to be developed for industrial applications. Graphitic films with thicknesses ranging from 3 to 20 nm have rarely been reported, and achieving the thickness uniformity in that range is a challenging task. In this study, a process for growing 20 nm-thick graphite films on Ni with improved thickness uniformity is demonstrated and compared with the conventional growth process. In the film grown by the process, the surface roughness and coverage were improved and no wrinkles were observed. Observations of the film structure reveal the reasons for the improvements and growth mechanisms.

  2. Film thickness effects in the CoSi1-xGex solid phase reaction

    International Nuclear Information System (INIS)

    Boyanov, B.I.; Goeller, P.T.; Sayers, D.E.; Nemanich, R.J.

    1998-01-01

    The thickness dependence of the reaction of cobalt with epitaxial silicon - germanium alloys (Si 1-x Ge x ) has been studied. The reaction products of Co with (100)-oriented Si 0.79 Ge 0.21 after annealing at 800 degree C depended on the thickness of the Co film. Complete conversion to CoSi 2 occurred only when the thickness of the Co layer exceeded 350 Angstrom. Interface reactions with Co layers thinner than 50 Angstrom resulted in CoSi formation, while a mixture of CoSi and CoSi 2 was formed at intermediate thicknesses. X-ray diffraction and extended x-ray absorption fine structure measurements indicated no measurable incorporation of Ge had occurred in either the CoSi or CoSi 2 . The threshold thickness for nucleation of CoSi 2 on (100)-oriented Si 1-x Ge x was determined in the range 0≤x≤0.25. The threshold thickness increased superlinearly with the Ge concentration x, and did not depend on the doping of the Si(100) substrate or the strain state of the Si 1-x Ge x film. The observed thickness effect was attributed to preferential Co - Si bonding in the reaction zone and the energy cost of Ge segregation, which accompanies the formation of CoSi and CoSi 2 during the reaction of Co with Si 1-x Ge x . copyright 1998 American Institute of Physics

  3. Quartz Microbalance Study of 400-angstrom Thick Films near the lambda Point

    Science.gov (United States)

    Chan, Moses H. W.

    2003-01-01

    In a recent measurement we observed the thinning of an adsorbed helium film induced by the confinement of critical fluctuations a few millikelvin below the lambda point. A capacitor set-up was used to measure this Casimir effect. In this poster we will present our measurement of an adsorbed helium film of 400 angstroms near the lambda point with a quartz microbalance. For films this thick, we must take into account the non-linear dynamics of the shear waves in the fluid. In spite of the added complications, we were able to confirm the thinning of the film due to the Casimir effect and the onset of the superfluid transition. In addition, we observe a sharp anomaly at the bulk lambda point, most likely related to critical dissipation of the first sound. This work is carried out in collaboration with Rafael Garcia, Stephen Jordon and John Lazzaretti. This work is funded by NASA's Office of Biological and Physical Research under grant.

  4. [Determination of film thickness, component and content based on glass surface by using XRF spectrometry].

    Science.gov (United States)

    Mei, Yan; Ma, Mi-Xia; Nie, Zuo-Ren

    2013-12-01

    Film thickness, component and content based on glass surface were determined by using XRF technic, measure condition and instrument work condition in every layer were set and adjusted for the best measure effect for every element. Background fundamental parameter (BG-FP) method was built up. Measure results with this method were consistent with the actual preparation course and the method could fit to production application.

  5. Thickness Dependence of Failure in Ultra-thin Glassy Polymer Films

    Science.gov (United States)

    Bay, Reed; Shimomura, Shinichiro; Liu, Yujie; Ilton, Mark; Crosby, Alfred

    The physical properties of polymer thin films change as the polymer chains become confined. Similar changes in mechanical properties have been observed, though these critical properties have only been explored a limited extent and with indirect methods. Here, we use a recently developed method to measure the complete uniaxial stress strain relationship of polymer thin films of polystyrene films (PS, Mw =130kg/mol, 490kg/mol, and 853kg/mol) as a function of thickness (20 nm-220nm). In this method, we hold a `dog-bone' shaped film on water between a flexible cantilever and a movable rigid boundary, measuring force-displacement from the cantilever deflection. From our measurements, we find that the modulus decreases as the PS chains become confined. The PS thin films exhibit ``ideal perfectly plastic'' behavior due to crazing, which differs from the typical brittle response of bulk PS. The draw stress due to crazing decreases with film thickness. These results provide new fundamental insight into how polymer behavior is altered due to structural changes in the entangled polymer network upon confinement. NSF DMR 1608614.

  6. Noise properties of Pb/Cd-free thick film resistors

    International Nuclear Information System (INIS)

    Stadler, Adam Witold; Kolek, Andrzej; Zawislak, Zbigniew; Mleczko, Krzysztof; Jakubowska, Malgorzata; Kielbasinski, Konrad Rafal; Mlozniak, Anna

    2010-01-01

    Low-frequency noise spectroscopy has been used to examine noise properties of Pb/Cd-free RuO 2 - and CaRuO 3 -based thick films screen printed on alumina substrates. Experiments were performed in the temperature range 77-300 K and the frequency range 0.5-5000 Hz with multiterminal devices. The measured noise has been recognized as resistance noise that consists of background 1/f noise and components generated by several thermally activated noise sources (TANSs) of different activation energies. The total noise has been composed of the contributions generated in the resistive layer and in the resistive/conductive layers interface. These noise sources are non-uniformly distributed in the resistor volume. Noise intensity of new-resistive layers has been described by the noise parameter C bulk . Pb/Cd-free layers turned out to be noisier than their Pb-containing counterparts; however, the removal of Pb and Cd from resistive composition is hardly responsible for the increase in the noise. In the case of RuO 2 layers noise increases most likely due to larger grain size of RuO 2 powder used to prepare resistive pastes. Information on the quality of the resistive-to-conductive layers interface occurred to be stored in the values of noise parameter C int . Pb/Cd-free RuO 2 -based resistive pastes form well-behaved interfaces with various Ag-based conductive pastes. In contrast, CaRuO 3 -based paste forms bad contacts with AgPd terminations because the density of TANSs increases in the interface area.

  7. Oscillatory magnetism of palladium nano-film depending on its film thickness: Density functional study

    International Nuclear Information System (INIS)

    Hong, Soon Cheol; Lee, Jae Il; Wu, Ruqian

    2007-01-01

    In order to investigate the magnetism of palladium nano-films, we performed first-principles calculations employing the highly precise full-potential linerized augmented plane-wave method based on density functional theory. The magnetism is investigated as a function of the thickness of the Pd thickness within a range of 1-21 monolayers. The magnetic stability of the Pd nano-films is calculated to depend delicately on its thickness. The ferromagnetic state is calculated to be stable for only some particular thicknesses of 1, 3, 9, and 15 layers. Invoking the ferromagnetism is not due to the localization at the surface but to the high density of states (DOS) at Fermi energy at the second layer from the surface

  8. Effects of film thickness and magnetism on the electronic structure of MnO films

    Science.gov (United States)

    Kundu, Asish K.; Barman, Sukanta; Menon, Krishnakumar S. R.

    2017-11-01

    We investigate the influence of film thickness and magnetism on the electronic structure of a strongly correlated prototypical system, MnO(001) films epitaxially grown on Ag(001), using angle-resolved photoemission spectroscopy (ARPES) and x-ray photoelectron spectroscopy (XPS) techniques. XPS measurements have confirmed the MnO stoichiometry as well as the layer-by-layer growth mode of the films, while the ARPES measurements have confirmed the high structural quality of the films by the observation of clear band dispersions devoid of any sample charging effects. For lower coverage films, finite-size effects/reduced correlation effects are observed, while from 3 ML coverages, bulklike band structures are formed. Detailed band mapping along Γ ¯-X ¯ and Γ ¯-M ¯ directions reveal a relative dispersion between Mn-derived eg and t2 g states up to 1.2 eV, in contrast to previous ARPES results where maximum relative dispersions of ±0.1 eV were reported, while our results excellently match with the theoretically predicted dispersions. By comparing with theoretical results we show the hybridization between O 2 p with the Mn eg states giving rise to the observed dispersions resulting from the highly dispersive nature of the O 2 p bands. Furthermore, we show that during the paramagnetic (PM) to antiferromagnetic (AFM) transition, the valence band gets narrower with an enhancement of the e5g peak intensity, along with the widening of the energy gap by 200 meV. Theoretically, Terakura et al. had predicted the possibility of a similar outcome due to the decrease of the effective d d hopping between the oppositely magnetized cations during the PM to AFM-II transition because of the d d σ type interaction, yet the experimental verification was absent in the literature. We believe that the exact same mechanism as predicted by Terakura et al. is responsible for the changes seen in the electronic structure during magnetic phase transition and argue that a similar trend can be

  9. Film thickness degradation of Au/GaN Schottky contact characteristics

    International Nuclear Information System (INIS)

    Wang, K.; Wang, R.X.; Fung, S.; Beling, C.D.; Chen, X.D.; Huang, Y.; Li, S.; Xu, S.J.; Gong, M.

    2005-01-01

    Electrical characteristics of Au/n-GaN Schottky contacts with different Au film thicknesses up to 1300 A, have been investigated using current-voltage (I-V) and capacitance-voltage (C-V) techniques. Results show a steady decrease in the quality of the Schottky diodes for increasing Au film thickness. I-V measurements indicate that thin ( 500 A). Depth profiling Auger electron spectroscopy (AES) shows that the width of the Au/GaN junction interface increases with increasing Au thickness, suggesting considerable inter-mixing of Au, Ga and N. The results have been interpreted in terms of Ga out-diffusion from the GaN giving rise to gallium vacancies that in turn act as sites for electron-hole pair generation within the depletion region. The study supports the recent suggestion that gallium vacancies associated with threaded dislocations are playing an important role in junction breakdown

  10. A thermal sensor for water using self-heated NTC thick-film segmented thermistors

    OpenAIRE

    Nikolić, Maria Vesna; Radojčić, B. M.; Aleksić, Obrad; Luković, Miloljub D.; Nikolić, Pantelija

    2011-01-01

    A simple thermal (heat loss) sensor system was designed in a small plastic tube housing using a negative thermal coefficient (NTC) thick-film thermistor as a self-heating sensor. The voltage power supply [range constant voltage (RCV)-range constant voltage] uses the measured input water temperature to select the applied voltage in steps (up and down) in order to enable operation of the sensor at optimal sensitivity for different water temperatures. The input water temperature was measured usi...

  11. Mandibular thickness measurements in young dentate adults.

    Science.gov (United States)

    Beaty, Narlin B; Le, Thomas T

    2009-09-01

    To measure thicknesses in clinical landmark areas of the dentate mandibles of young men and women. Using standard radiologic software, we obtained mean (SD) thickness measurements at the inferior or posterior borders of the mandible at the following 7 surgically useful sites: (1) the symphysis, (2) a point halfway between the symphysis and the mental nerve, (3) the mental nerve, (4) a point halfway between the mental nerve and the facial artery notch, (5) the facial artery notch, (6) the angle vertex, and (7) the ramus-condylar neck border. University hospital. A total of 150 dentate men and 75 dentate women aged 18 to 30 years who had undergone computed tomography of the head and neck region during the period of December 20, 2006 to February 20, 2007. Thicknesses of 7 mandibular sites. Mean (SD) thicknesses at the 7 mandibular sites were as follows: symphysis, 14.03 (1.53) mm for men and 13.21 (1.46) mm for women; halfway between the symphysis and the mental nerve, 11.17 (1.37) mm for men and 10.00 (1.08) mm for women; mental nerve, 9.48 (1.28) mm for men and 8.72 (1.00) mm for women; halfway between the mental nerve and the facial artery notch, 10.33 (1.24) mm for men and 9.45 (0.92) mm for women; facial artery notch, 7.27 (0.82) mm for men and 7.10 (0.88) mm for women; angle vertex, 5.42 (0.90) mm for men and 5.39 (0.66) mm for women; and ramus-condylar neck border, 5.90 (0.86) mm for men and 5.85 (0.71) mm for women. Clinical landmark areas in young dentate mandibles have mean thicknesses with limited SDs. The thickness measurements obtained at the sites in this study provide practical reference information for mandibular reconstruction and bicortical screw length estimation.

  12. Preparation and characterization of thick BSCCO 2223 films

    International Nuclear Information System (INIS)

    Ciancio, G; Avila, A; Malachevsky, M.T; Ovidio, C.A

    2002-01-01

    Among the most widespread applications for critical high-temperature ceramic superconductors are for silver veined tapes, with the superconductor in the middle. These tapes are prepared by the powder- in - tube method. To attain high densities of critical current, the ceramic material must have a certain texture, with the grains oriented with the c axis perpendicular to the direction in which the current circulates. In the system that was studied, the degree of orientation increases as the distance to the vein decreases, with the maximum being in the silver-ceramic inter-phase. Superconductor tapes become inconvenient when defining the ceramic, especially because of the orientation of their plates as a function of the distance to the silver. Although the silver can be dissolved by a chemical attack in order to uncover the ceramic, greater precaution is needed while manipulating the superconductor and obtaining representative data. The behavior of thick films of the compound BSCCO 2223, deposited on silver sheets, forming silver-ceramic composites, was studied. These sheets simulate the silver-ceramic inter-phase and the distribution of the grains towards the center in a thick tape. After the samples were prepared, the phases that were present were characterized by x-ray diffraction and the resulting microstructure was analyzed with a SEM (Scanning Electron Microscope). Its mechanical properties were evaluated, following the formation and propagation of cracks in real time using four point flexion microassays inside the SEM chamber, as well as generating tension-deformation curves. The method of preparation of the thick films is discussed and its influence on the results obtained with the different characterizations (cw)

  13. Cement thickness measurements in cased boreholes

    International Nuclear Information System (INIS)

    Wahl, J.S.; Schuster, N.A.

    1978-01-01

    Methods and apparatus are provided for logging a borehole having solid matter along at least a portion of the wall thereof. Gamma radiation is emitted from the borehole into the surrounding media, and the amount of radiation which returns to the borehole is measured by three detectors located at different distances from the source of radiation, so as to be primarily sensitive to radiation which has respectively penetrated to three different depths in the surrounding media. The thickness of the solid matter on the borehole wall is then determined from the three gamma radiation measurements

  14. Anomalous conductivity dependence of plasticized PVC for different modificator "A" concentrations and film thicknesses

    OpenAIRE

    Vlasov, D. V.; Apresyan, L. A.; Vlasov, A. D.; Kryshtob, V. I.

    2011-01-01

    The dependences of electrical conductivity of plasticized PVC films on mass fraction of plasticizer "A" and the film thickness are experimentally investigated. Non-monotonic dependence of conductivity on the concentration of plasticizer and strongly nonlinear dependence of the resistance of the film on its thickness are found. Possibility of construction of the models describing received results is shown and also discussed.

  15. Ethanol vapour sensing properties of screen printed WO3 thick films

    Indian Academy of Sciences (India)

    TECS

    have been used to develop varistors, sensors and actua- tors (Prudenziati 1994). The thick film gas sensors based ... sively studied gases in the thick film gas sensors. The detection of ethanol vapour based on thin film of SnO2. (Mishra et ... The organic vehicles such as butyl carbitol acetate (BCA) and ethyl cellulose were.

  16. Behavior of resin-based endodontic sealer cements in thin and thick films.

    Science.gov (United States)

    Pane, Epita S; Palamara, Joseph E A; Messer, Harold H

    2012-09-01

    For root canal fillings, a thin layer of sealer cement is generally recommended. However, with resin-based sealers, lower bond strength to dentin has been shown in thin layers compared to thick, contrary to typical behavior of adhesive layers between two adherents. The aim of this study was to evaluate tensile and shear bond strength of thin and thick films of three resin-based sealers (one epoxy-based and two methacrylate-based) materials and to investigate corner effects of one methacrylate-based resin sealer. Freshly mixed sealer cements were placed between metal-to-metal surfaces of plano-parallel stainless steel aligned rods with diameter 4.7 mm. Ten samples were prepared for each type, thickness (0.1 and 1.0 mm) of sealer and test. Tensile and shear strengths were measured after 48 h for the methacrylate-based materials and after 7 days for the epoxy-based material using a universal testing machine at a crosshead speed of 1mm/min. Corner effects were investigated using one methacrylate-based resin material. Film thickness had a highly significant influence on both tensile and shear strengths. For methacrylate resin-based sealers, thin films had higher bond strength than thick (ptensile and shear bond strength). With the epoxy-based sealer either no difference (shear) or lower bond strength in thin films (tensile; ptensile bond strength results. The higher tensile and shear bond strength of resin-based sealer in thin films is the opposite of that previously reported for bonding to dentin. The substrate clearly has an important role in failure behavior. Copyright © 2012 Academy of Dental Materials. Published by Elsevier Ltd. All rights reserved.

  17. Effect of preheating on the film thickness of contemporary composite restorative materials

    Directory of Open Access Journals (Sweden)

    Dimitrios Dionysopoulos

    2014-12-01

    Conclusion: The film thickness of the composites tested is material dependent. The thickness of the preheated conventional composites is significantly lower than those at room temperature. The conventional composites provide film thickness values greater than those of the flowable composites regardless of preheating temperature.

  18. Determination of the refractive index and thickness of a thin film embedded in a given stratified medium.

    Science.gov (United States)

    Chabrier, G; Goudonnet, J P; Vernier, P

    1989-07-15

    A thin film deposited on the plane face of a glass substrate or a thin film embedded in a known stratified medium can be characterized by nondestructive optical measurements: transmittance and reflectance for several angles of incidence with s and p polarization. We present here a graphic method for determining the complex refractive index and thickness for thin film optical characterization. Light entering into the medium through a prism or half-cylinder [attenuated total reflection (ATR)] extends the usable angles. Applications are made to very thin metallic films and dielectric films (SiO(x)).

  19. Measuring coating thicknesses on continuously moving material

    International Nuclear Information System (INIS)

    Holler, J.H.; Stanton, W.B.; Spongr, J.J.; Joffe, B.B.; Raffelsberger, P.W.; Tiebor, J.E.

    1982-01-01

    A method and apparatus using radiation techniques for measuring coating thicknesses on continuously moving strip material without altering a predetermined path along which it travels. A shuttle carrying a measuring probe having a radioactive isotope source and a detection device is provided for reciprocation along a preselected segment of the path of the strip. The shuttle and the probe are releasably engaged with the strip and carried thereby for synchronous movement therewith in the forward direction during a measurement cycle, and are disengaged from the strip when no measurement is being made, the movement of the shuttle then being controlled by an independent drive mechanism, shown as a belt drive, which reciprocates the shuttle along the rails. A belt drives it forward more slowly than the strip, which then engages the shuttle to pull it at strip speed, allowed by a pulley clutch. (author)

  20. Critical current densities in thick yttrium-barium cuprate (1-2-3) films

    International Nuclear Information System (INIS)

    Ryvkina, G.G.; Gorlanov, S.F.; Vedernikov, G.E.; Telegin, A.B.; Ryabin, V.A.; Khodos, M.Ya.

    1993-01-01

    The study of critical current densities j c of oxide superconductors and their thick films is a very important practical task because the value of j c is one of the main criteria for their utilization in modern cryoelectronics. For most devices based on the Josephson effect, the value of j c ∼ 10 2 - 10 3 A/cm 2 is acceptable, which is easily attainable for polycrystalline thick films obtained by stenciling. The study of the current-transport phenomenon involves a number of difficulties, especially for direct current, because both the sample itself and the lead-in contacts are resistance-heated during the measurements, which, in turn, results in lower values of the j c . Measurements with pulsed currents allow one to lower the power that is applied to the sample; the heat that is released in the sample is reduced, in comparison to measurements with direct current, by a factor of the pulsed-current duty cycle. In addition, measurements with direct current detects only the appearance of resistance; it provides no information on the rest of the transition from the normal to the superconductive state, i.e., on the so-called 'tail' of the transition. In this work, the authors studied critical current densities of thick HTSC yttrium-barium cuprate films of the 1-2-3 composition using pulsed current

  1. LTCC Phase Shifters Based on Tunable Ferroelectric Composite Thick Films

    Science.gov (United States)

    Nikfalazar, M.; Kohler, C.; Heunisch, A.; Wiens, A.; Zheng, Y.; Schulz, B.; Mikolajek, M.; Sohrabi, M.; Rabe, T.; Binder, J. R.; Jakoby, R.

    2015-11-01

    This paper presents, the investigation of tunable components based on LTCC technology, implementing ferroelectric tunable thick-film dielectric. The tunable loaded line phase shifters are fabricated with metal-insulator-metal (MIM) varactors to demonstrate the capabilities of this method for packaging of the tunable components. The MIM varactors consist of one tunable dielectric paste layer that is printed between two silver layers. The tunable ferroelectric paste is optimized for LTCC sintering temperature around 850°C. The phase shifters are fabricated in two different process. They were achieved a figure of merit of 24°/dB (phase shift 192°) at 3 GHz and 18°/dB (phase shift 98°) at 4.4 GHz by using seven unit cells that each unit cell consisting of two MIM varactors.

  2. Overlay mark optimization for thick-film resist overlay metrology

    Energy Technology Data Exchange (ETDEWEB)

    Zhu Liang [Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050 (China); Li Jie; Zhou Congshu; Gu Yili; Yang Huayue, E-mail: liang.zhu@gracesemi.co [Grace Semiconductor Manufacturing Corporation, Shanghai 201203 (China)

    2009-06-01

    For thick resist implant layers, such as a high voltage P well and a deep N well, systematic and uncorrectable overlay residues brought about by the tapered resist profiles were found. It was found that the tapered profile is closely related to the pattern density. Potential solutions of the manufacturing problem include hardening the film solidness or balancing the exposure density. In this paper, instead of focusing on the process change methodology, we intend to solve the issue of the overlay metrology error from the perspective of the overlay mark design. Based on the comparison of the overlay performances between the proposed overlay mark and the original design, it is shown that the optimized overlay mark target achieves better performance in terms of profiles, dynamic precision, tool induced shift (TIS), and residues. Furthermore, five types of overlay marks with dummy bars are studied, and a recommendation for the overlay marks is given.

  3. Charge transport in films of Geobacter sulfurreducens on graphite electrodes as a function of film thickness

    KAUST Repository

    Jana, Partha Sarathi

    2014-01-01

    Harnessing, and understanding the mechanisms of growth and activity of, biofilms of electroactive bacteria (EAB) on solid electrodes is of increasing interest, for application to microbial fuel and electrolysis cells. Microbial electrochemical cell technology can be used to generate electricity, or higher value chemicals, from organic waste. The capability of biofilms of electroactive bacteria to transfer electrons to solid anodes is a key feature of this emerging technology, yet the electron transfer mechanism is not fully characterized as yet. Acetate oxidation current generated from biofilms of an EAB, Geobacter sulfurreducens, on graphite electrodes as a function of time does not correlate with film thickness. Values of film thickness, and the number and local concentration of electrically connected redox sites within Geobacter sulfurreducens biofilms as well as a charge transport diffusion co-efficient for the biofilm can be estimated from non-turnover voltammetry. The thicker biofilms, of 50 ± 9 μm, display higher charge transport diffusion co-efficient than that in thinner films, as increased film porosity of these films improves ion transport, required to maintain electro-neutrality upon electrolysis. This journal is © the Partner Organisations 2014.

  4. Structural and electronic characterization of 355 nm laser-crystallized silicon: Interplay of film thickness and laser fluence

    International Nuclear Information System (INIS)

    Semler, Matthew R.; Swenson, Orven F.; Hoey, Justin M.; Guruvenket, Srinivasan; Gette, Cody R.; Hobbie, Erik K.

    2014-01-01

    We present a detailed study of the laser crystallization of amorphous silicon thin films as a function of laser fluence and film thickness. Silicon films grown through plasma-enhanced chemical vapor deposition were subjected to a Q-switched, diode-pumped solid-state laser operating at 355 nm. The crystallinity, morphology, and optical and electronic properties of the films are characterized through transmission and reflectance spectroscopy, resistivity measurements, Raman spectroscopy, X-ray diffraction, atomic force microscopy, and optical and scanning-electron microscopy. Our results reveal a unique surface morphology that strongly couples to the electronic characteristics of the films, with a minimum laser fluence at which the film properties are optimized. A simple scaling model is used to relate film morphology to conductivity in the laser-processed films

  5. Photometer for monitoring the thickness of inkjet printed films for organic electronic and sensor applications.

    Science.gov (United States)

    Im, Jisun; Sengupta, Sandip K; Whitten, James E

    2010-03-01

    Inkjet printed organic thin films are being used for a variety of electronic and sensor applications with advantages that include ease of fabrication and reproducibility. Construction and use of a low-cost photometer based on a light-emitting diode (LED) light source and a photodiode detector are described. The photometer attaches to the exit of the printer with the transparent substrate onto which the film is printed passing between the LED and photodiode. By measuring the output voltage of the detector, the transmittance and absorbance of the inkjet printed film can be calculated in real-time. Since absorbance is linearly proportional to thickness in the Beer-Lambert regime, the thickness of the film may be monitored and controlled by varying the number of passes through the printer. Use of the photometer is demonstrated for inkjet printed films of monolayer-protected colloidal gold nanoparticles that function as chemical vapor sensors. The photometer may find applications in both research and quality control related to the manufacture of organic electronic devices and sensors and enables "feedback-controlled" inkjet printing.

  6. The spatial thickness distribution of metal films produced by large area pulsed laser deposition

    International Nuclear Information System (INIS)

    Pryds, Nini; Schou, Jorgen; Linderoth, Soren

    2007-01-01

    Thin films of metals have been deposited in the large-area Pulsed Laser Deposition (PLD) Facility at Riso National Laboratory. Thin films of Ag and Ni were deposited with laser pulses from an excimer laser at 248 nm with a rectangular beam spot at a fluence of 10 J/cm 2 on glass substrates of 127 mm diameter positioned 80 mm from the target in vacuum. We have explored the distribution of deposited material on a stationary substrate from a fixed point of impact on the target relative to the substrate. In all cases the angular distribution of the deposited metal layers shows a distinct 'flip-over' of the plume. The thickness of the deposited films over the full area has been determined by energy-dispersive X-ray spectrometry in a scanning electron microscope (SEM). The measured distributions were then compared with analytical expressions. Finally, the angular distribution of the film thickness has been utilized in an algorithm for production of films over large areas

  7. Orientation and thickness dependence of magnetization at the interfacesof highly spin-polarized manganite thin films

    Energy Technology Data Exchange (ETDEWEB)

    Chopdekar, Rajesh V.; Arenholz, Elke; Suzuki, Y.

    2008-08-18

    We have probed the nature of magnetism at the surface of (001), (110) and (111)-oriented La{sub 0.7}Sr{sub 0.3}MnO{sub 3} thin films. The spin polarization of La{sub 0.7}Sr{sub 0.3}MnO{sub 3} thin films is not intrinsically suppressed at all surfaces and interfaces but is highly sensitive to both the epitaxial strain state as well as the substrate orientation. Through the use of soft x-ray spectroscopy, the magnetic properties of (001), (110) and (111)-oriented La{sub 0.7}Sr{sub 0.3}MnO{sub 3}/SrTiO{sub 3} interfaces have been investigated and compared to bulk magnetometry and resistivity measurements. The magnetization of (110) and (111)-oriented La{sub 0.7}Sr{sub 0.3}MnO{sub 3}/SrTiO{sub 3} interfaces are more bulk-like as a function of thickness whereas the magnetization at the (001)-oriented La{sub 0.7}Sr{sub 0.3}MnO{sub 3}/SrTiO{sub 3} interface is suppressed significantly below a layer thickness of 20 nm. Such findings are correlated with the biaxial strain state of the La{sub 0.7}Sr{sub 0.3}MnO{sub 3} films; for a given film thickness it is the tetragonal distortion of (001) La{sub 0.7}Sr{sub 0.3}MnO{sub 3} that severely impacts the magnetization, whereas the trigonal distortion for (111)-oriented films and monoclinic distortion for (110)-oriented films have less of an impact. These observations provide evidence that surface magnetization and thus spin polarization depends strongly on the crystal surface orientation as well as epitaxial strain.

  8. A study on the evolution of dielectric function of ZnO thin films with decreasing film thickness

    International Nuclear Information System (INIS)

    Li, X. D.; Chen, T. P.; Liu, P.; Liu, Y.; Liu, Z.; Leong, K. C.

    2014-01-01

    Dielectric function, band gap, and exciton binding energies of ultrathin ZnO films as a function of film thickness have been obtained with spectroscopic ellipsometry. As the film thickness decreases, both real (ε 1 ) and imaginary (ε 2 ) parts of the dielectric function decrease significantly, and ε 2 shows a blue shift. The film thickness dependence of the dielectric function is shown related to the changes in the interband absorption, discrete-exciton absorption, and continuum-exciton absorption, which can be attributed to the quantum confinement effect on both the band gap and exciton binding energies

  9. Characterization of thick and thin film SiCN for pressure sensing at high temperatures.

    Science.gov (United States)

    Leo, Alfin; Andronenko, Sergey; Stiharu, Ion; Bhat, Rama B

    2010-01-01

    Pressure measurement in high temperature environments is important in many applications to provide valuable information for performance studies. Information on pressure patterns is highly desirable for improving performance, condition monitoring and accurate prediction of the remaining life of systems that operate in extremely high temperature environments, such as gas turbine engines. A number of technologies have been recently investigated, however these technologies target specific applications and they are limited by the maximum operating temperature. Thick and thin films of SiCN can withstand high temperatures. SiCN is a polymer-derived ceramic with liquid phase polymer as its starting material. This provides the advantage that it can be molded to any shape. CERASET™ also yields itself for photolithography, with the addition of photo initiator 2, 2-Dimethoxy-2-phenyl-acetophenone (DMPA), thereby enabling photolithographical patterning of the pre-ceramic polymer using UV lithography. SiCN fabrication includes thermosetting, crosslinking and pyrolysis. The technology is still under investigation for stability and improved performance. This work presents the preparation of SiCN films to be used as the body of a sensor for pressure measurements in high temperature environments. The sensor employs the phenomenon of drag effect. The pressure sensor consists of a slender sensitive element and a thick blocking element. The dimensions and thickness of the films depend on the intended application of the sensors. Fabrication methods of SiCN ceramics both as thin (about 40-60 μm) and thick (about 2-3 mm) films for high temperature applications are discussed. In addition, the influence of thermosetting and annealing processes on mechanical properties is investigated.

  10. Characterization of Thick and Thin Film SiCN for Pressure Sensing at High Temperatures

    Directory of Open Access Journals (Sweden)

    Rama B. Bhat

    2010-02-01

    Full Text Available Pressure measurement in high temperature environments is important in many applications to provide valuable information for performance studies. Information on pressure patterns is highly desirable for improving performance, condition monitoring and accurate prediction of the remaining life of systems that operate in extremely high temperature environments, such as gas turbine engines. A number of technologies have been recently investigated, however these technologies target specific applications and they are limited by the maximum operating temperature. Thick and thin films of SiCN can withstand high temperatures. SiCN is a polymer-derived ceramic with liquid phase polymer as its starting material. This provides the advantage that it can be molded to any shape. CERASET™ also yields itself for photolithography, with the addition of photo initiator 2, 2-Dimethoxy-2-phenyl-acetophenone (DMPA, thereby enabling photolithographical patterning of the pre-ceramic polymer using UV lithography. SiCN fabrication includes thermosetting, crosslinking and pyrolysis. The technology is still under investigation for stability and improved performance. This work presents the preparation of SiCN films to be used as the body of a sensor for pressure measurements in high temperature environments. The sensor employs the phenomenon of drag effect. The pressure sensor consists of a slender sensitive element and a thick blocking element. The dimensions and thickness of the films depend on the intended application of the sensors. Fabrication methods of SiCN ceramics both as thin (about 40–60 µm and thick (about 2–3 mm films for high temperature applications are discussed. In addition, the influence of thermosetting and annealing processes on mechanical properties is investigated.

  11. Influences of layer thickness on the compatibility and physical properties of polycarbonate/polystyrene multilayered film via nanolayer coextrusion

    Science.gov (United States)

    Cheng, Junfeng; Chen, Zhiru; Zhou, Jiaqi; Cao, Zheng; Wu, Dun; Liu, Chunlin; Pu, Hongting

    2018-05-01

    The effects of layer thickness on the compatibility between polycarbonate (PC) and polystyrene (PS) and physical properties of PC/PS multilayered film via nanolayer coextrusion are studied. The morphology of multilayered structure is observed using a scanning electron microscope. This multilayered structure may have a negative impact on the transparency, but it can improve the water resistance and heat resistance of film. To characterize the compatibility between PC and PS, differential scanning calorimetry is used to measure the glass transition temperature. The compatibility is found to be improved with the decrease of layer thickness. Therefore, the viscosity of multilayered film is also reduced with the decrease of layer thickness. In addition, the multilayered structure can improve the tensile strength with the increase of layer numbers. Because of the complete and continuous layer structure of PC, the PC/PS multilayered film can retain its mechanical strength at the temperature above Tg of PS.

  12. Magnetization and flux creep in thin YBa2Cu3O7-δ films of various thickness

    International Nuclear Information System (INIS)

    Sheriff, E.; Prozorov, R.; Yeshurun, Y.; Shaulov, A.; Koren, G.; Chabaud-Villard, C.

    1997-01-01

    We report on the thickness dependence of the irreversible magnetization in superconducting Y 1 Ba 2 Cu 3 O 7-δ films of thickness 350 endash 3000 Angstrom. Our results reveal a nonmonotonous dependence of the persistent current density j on the film thickness, which is interpreted in terms of surface pinning and variations in the surface microstructure. Measurements of the time dependence of j show that under certain conditions relaxation curves of samples of different thickness cross each other, i.e., the sample with initially larger j exhibits after some time a lower j. The crossing point is shifted to shorter times as the temperature is increased. We propose a simple explanation to this effect and discuss its practical implications. Low dose heavy ion irradiation of the films has a modest effect on j and on the rate of its relaxation. copyright 1997 American Institute of Physics

  13. The thickness of DLC thin film affects the thermal conduction of HPLED lights

    Science.gov (United States)

    Hsu, Ming Seng; Huang, Jen Wei; Shyu, Feng Lin

    2016-09-01

    Thermal dissipation had an important influence in the quantum effect and life of light emitting diodes (LED) because it enabled heat transfer away from electric devices to the aluminum plate for heat removal. In the industrial processing, the quality of the thermal dissipation was decided by the gumming technique between the PCB and aluminum plate. In this study, we made the ceramic thin films of diamond like carbon (DLC) by vacuum sputtering between the substrate and high power light emitting diodes (HPLED) light to check the influence of heat transfer by DLC thin films. The ceramic dielectric coatings were characterized by several subsequent analyses, especially the measurement of real work temperature of HPLEDs. The X-Ray photoelectron spectroscopy (XPS) patterns revealed that ceramic phases were successfully grown onto the substrate. At the same time, the real work temperatures showed the thickness of DLC thin film coating effectively affected the thermal conduction of HPLEDs.

  14. Characterization of the magnetic properties of NdFeB thick films exposed to elevated temperatures

    Science.gov (United States)

    Fujiwara, Ryogen; Devillers, Thibaut; Givord, Dominique; Dempsey, Nora M.

    2018-05-01

    Hard magnetic films used in magnetic micro-systems may be exposed to elevated temperatures during film and system fabrication and also during use of the micro-system. In this work, we studied the influence of temperature on the magnetic properties of 10 μm thick out-of-plane textured NdFeB films fabricated by high rate triode sputtering. Out-of-plane hysteresis loops were measured in the range 300K - 650K to establish the temperature dependence of coercivity, magnetization at 7 T and remanent magnetization. Thermal demagnetization was measured and magnetization losses were recorded from 350K in films heated under zero or low (-0.1 T) external field and from 325 K for films heated under an external field of -0.5 T. The effect of thermal cycling under zero field on the remanent magnetization was also studied and it was found that cycling between room temperature and 323 K did not lead to any significant loss in remanence at room temperature, while a 4% drop is recorded when the sample is cycled between RT and 343K. Measurement of hysteresis loops at room temperature following exposure to elevated temperatures reveals that while remanent magnetisation is practically recovered in all cases, irreversible losses in coercivity occur (6.7 % following heating to 650K, and 1.3 % following heating to 343K). The relevance of these results is discussed in terms of system fabrication and use.

  15. Scaling of elongation transition thickness during thin-film growth on weakly interacting substrates

    Science.gov (United States)

    Lü, B.; Souqui, L.; Elofsson, V.; Sarakinos, K.

    2017-08-01

    The elongation transition thickness ( θElong) is a central concept in the theoretical description of thin-film growth dynamics on weakly interacting substrates via scaling relations of θElong with respect to rates of key atomistic film-forming processes. To date, these scaling laws have only been confirmed quantitatively by simulations, while experimental proof has been left ambiguous as it has not been possible to measure θElong. Here, we present a method for determining experimentally θElong for Ag films growing on amorphous SiO2: an archetypical weakly interacting film/substrate system. Our results confirm the theoretically predicted θElong scaling behavior, which then allow us to calculate the rates of adatom diffusion and island coalescence completion, in good agreement with the literature. The methodology presented herein casts the foundation for studying growth dynamics and cataloging atomistic-process rates for a wide range of weakly interacting film/substrate systems. This may provide insights into directed growth of metal films with a well-controlled morphology and interfacial structure on 2D crystals—including graphene and MoS2—for catalytic and nanoelectronic applications.

  16. Effects of high voltage pulse trimming on structural properties of thick-film resistors

    Directory of Open Access Journals (Sweden)

    Stanimirović Zdravko

    2017-01-01

    Full Text Available Nowadays, compact and reliable electronic devices including up-to-date ceramic micro-electro-mechanical systems require thick-film resistors with significantly reduced dimensions and stable and precise resistance values. For that reason, instead of standard laser trimming method, high voltage pulse trimming of thick-film resistors is being introduced. This method allows controlled and reliable resistance adjustment regardless of resistor position or dimensions and without the presence of cuts. However, it causes irreversible structural changes in the pseudorandom network formed during sintering causing the changes in conducting mechanisms. In this paper results of the experimental investigation of high voltage pulse trimming of thick-film resistors are presented. Obtained results are analyzed and correlations between resistance and low-frequency noise changes and changes in conducting mechanisms in resistors due to high voltage pulse trimming are observed. Sources of measured fluctuations are identified and it is shown that this type of trimming is a valid alternative trimming method to the dominant laser trimming. [Project of the Serbian Ministry of Education, Science and Technological Development, Grant no. III44003 and III45007

  17. High-performance piezoelectric thick film based energy harvesting micro-generators for MEMS

    DEFF Research Database (Denmark)

    Zawada, Tomasz; Hansen, Karsten; Lou-Moeller, Rasmus

    2010-01-01

    , devices based on modified, pressure treated thick film materials have been tested and compared with the commercial InSensor® TF2100 PZT thick films. It has been found that the structures based on the pressure treated materials exhibit superior properties in terms of energy output....

  18. Influence of the processing parameters of slurries for the deposit of nickelate thick films

    International Nuclear Information System (INIS)

    Castillo, S.; Cienfuegos, R.F.; Fontaine, M.L.; Lenormand, P.; Bacchin, P.; Ansart, F.

    2007-01-01

    Thick films cathodes for Solid Oxide Fuel Cells (SOFC) are prepared by dip-coating slurries made of several lanthanum nickelate oxide powders onto yttria stabilized zirconia (YSZ) substrates. The processing parameters for the slurries preparation and the multilayers coating have been optimized to obtain homogeneous, crack-free, thick and adherent films after heat treatment

  19. Investigation of Top/Bottom electrode and Diffusion Barrier Layer for PZT Thick Film MEMS Sensors

    DEFF Research Database (Denmark)

    Hindrichsen, Christian Carstensen; Pedersen, Thomas; Thomsen, Erik Vilain

    2008-01-01

    Top and bottom electrodes for screen printed piezoelectric lead zirconate titanate, Pb(ZrxTi1 - x)O3 (PZT) thick film are investigated with respect to future MEMS devices. Down to 100 nm thick E-beam evaporated Al and Pt films are patterned as top electrodes on the PZT using a lift-off process...

  20. Existence of thickness threshold for crystal growth rate of ascorbic acid from its thin solution film

    Science.gov (United States)

    Yamazaki, Yoshihiro; Yoshino, Hiroki; Kikuchi, Mitsunobu; Kashiwase, Sakiko

    2017-06-01

    Growth rate of ascorbic acid crystal domains from its aqueous solution film depends on the film thickness. Existence of a thickness threshold is experimentally confirmed below which growth rate becomes quite low and is considered to almost stop. This threshold is one of the essential factors for the dynamical transition between uniform and rhythmic growth modes.

  1. Ethanol vapour sensing properties of screen printed WO 3 thick films

    Indian Academy of Sciences (India)

    The ethanol vapour sensing properties of these thick films were investigated at different operating temperatures and ethanol vapour concentrations. The WO3 thick films exhibit excellent ethanol vapour sensing properties with a maximum sensitivity of ∼1424.6% at 400°C in air atmosphere with fast response and recovery ...

  2. Effect of microstructure and rheology on the grease EHL film thickness at medium speeds

    NARCIS (Netherlands)

    Cyriac, F.; Lugt, P. M.; Bosman, R.; Padberg, C. J.; Venner, C. H.

    2016-01-01

    In this study the parameters influencing the film thickness of six greases in a rolling elastohydrodynamically lubricated contact under fully flooded conditions are analyzed. The grease film thickness was found to be higher than their corresponding bled oil suggesting the presence of thickener in

  3. State of the art in thin film thickness and deposition rate monitoring sensors

    International Nuclear Information System (INIS)

    Buzea, Cristina; Robbie, Kevin

    2005-01-01

    In situ monitoring parameters are indispensable for thin film fabrication. Among them, thickness and deposition rate control are often the most important in achieving the reproducibility necessary for technological exploitation of physical phenomena dependent on film microstructure. This review describes the types of thickness and deposition rate sensors and their theoretical and phenomenological background, underlining their performances, as well as advantages and disadvantages

  4. The effects of film thickness on the electrical, optical, and structural properties of cylindrical, rotating, magnetron-sputtered ITO films

    Science.gov (United States)

    Kim, Jae-Ho; Seong, Tae-Yeon; Ahn, Kyung-Jun; Chung, Kwun-Bum; Seok, Hae-Jun; Seo, Hyeong-Jin; Kim, Han-Ki

    2018-05-01

    We report the characteristics of Sn-doped In2O3 (ITO) films intended for use as transparent conducting electrodes; the films were prepared via a five-generation, in-line type, cylindrical, rotating magnetron sputtering (CRMS) system as a function of film thickness. By using a rotating cylindrical ITO target with high usage (∼80%), we prepared high conductivity, transparent ITO films on five-generation size glass. The effects of film thickness on the electrical, optical, morphological, and structural properties of CRMS-grown ITO films are investigated in detail to correlate the thickness and performance of ITO films. The preferred orientation changed from the (2 2 2) to the (4 0 0) plane with increasing thickness of ITO is attributed to the stability of the (4 0 0) plane against resputtering during the CRMS process. Based on X-ray diffraction, surface field emission scanning electron microscopy, and cross-sectional transmission electron microscopy, we suggest a possible mechanism to explain the preferred orientation and effects of film thickness on the performance of CRMS-grown ITO films.

  5. Effect of Firing Temperature on Humidity Sensing Properties of SnO2 Thick Film Resistor

    Directory of Open Access Journals (Sweden)

    R. Y. Borse

    2009-12-01

    Full Text Available Thick films of SnO2 were prepared using standard screen printing technique. The films were dried and fired at different temperatures. Tin-oxide is an n-type wide band gap semiconductor, whose resistance is described as a function of relative humidity. An increasing firing temperature on SnO2 film increases the sensitivity to humidity. The parameters such as sensitivity, response times and hysteresis of the SnO2 film sensors have been evaluated. The thick films were characterized by XRD, SEM and EDAX and grain size, composition of elements, relative phases are obtained.

  6. Flexoelectricity induced increase of critical thickness in epitaxial ferroelectric thin films

    International Nuclear Information System (INIS)

    Zhou Hao; Hong Jiawang; Zhang Yihui; Li Faxin; Pei Yongmao; Fang Daining

    2012-01-01

    Flexoelectricity describes the coupling between polarization and strain/stress gradients in insulating crystals. In this paper, using the Landau-Ginsburg-Devonshire phenomenological approach, we found that flexoelectricity could increase the theoretical critical thickness in epitaxial BaTiO 3 thin films, below which the switchable spontaneous polarization vanishes. This increase is remarkable in tensile films while trivial in compressive films due to the electrostriction caused decrease of potential barrier, which can be easily destroyed by the flexoelectricity, between the ferroelectric state and the paraelectric state in tensile films. In addition, the films are still in a uni-polar state even below the critical thickness due to the flexoelectric effect.

  7. Effect of thickness and temperature of copper phthalocyanine films on their properties

    Directory of Open Access Journals (Sweden)

    Alieva Kh. S.

    2012-06-01

    Full Text Available The research has shown that copper phthalocyanine films, having a set of unique properties, can be successfully used as gas-sensitive coating of resistive structures. The thickness of the film, in contrast to its temperature, is not the determining factor for high sensitivity. Low operating temperature of structures with copper phthalocyanine films allows to exploit them in economy mode.

  8. Influence of thin film thickness of working electrodes on photovoltaic characteristics of dye-sensitized solar cells

    Directory of Open Access Journals (Sweden)

    Lai Yeong-Lin

    2017-01-01

    Full Text Available This paper presents the study of the influence of thin film thickness of working electrodes on the photovoltaic characteristics of dye-sensitized solar cells. Titanium dioxide (TiO2 thin films, with the thickness from 7.67 to 24.3 μm, were used to fabricate the working electrodes of dye-sensitized solar cells (DSSCs. A TiO2 film was coated on a fluorine-doped tin oxide (FTO conductive glass substrate and then sintered in a high-temperature furnace. On the other hand, platinum (Pt solution was coated onto an FTO substrate for the fabrication of the counter electrode of a DSSC. The working electrode immersed in a dye, the counter electrode, and the electrolyte were assembled to complete a sandwich-structure DSSC. The material analysis of the TiO2 films of DSSCs was carried out by scanning electron microscopy (SEM and ultraviolet-visible (UV-Vis spectroscopy, while the photovoltaic characteristics of DSSCs were measured by an AM-1.5 sunlight simulator. The light transmittance characteristics of the TiO2 working electrode depend on the TiO2 film thickness. The thin film thickness of the working electrode also affects the light absorption of a dye and results in the photovoltaic characteristics of the DSSC, including open-circuited voltage (VOC, short-circuited current density (JSC, fill factor, and photovoltaic conversion efficiency.

  9. Preparation of a high-quality PZT thick film with performance comparable to those of bulk materials for applications in MEMS

    Science.gov (United States)

    Xu, Xiao-Hui; Chu, Jia-Ru

    2008-06-01

    High-quality lead zirconate titanate (PZT) thick films have been prepared on silicon substrates by combining PZT-Si bonding and wet-etching technology. The bulk PZT wafer was first bonded to the silicon substrate using a 2 µm thick intermediate layer of epoxy resin with a bonding strength higher than 10 MPa. Then the bulk PZT was thinned by a wet-etching method. The thickness of the final PZT films depends on the etching time. The PZT thick films after being polished showed a surface roughness of about 20 nm (RMS), which can satisfy most of the requirements in MEMS. The prepared PZT thick films show a dielectric constant as high as 2400 below 100 kHz, remnant polarization of 13 µC cm-2, piezoelectric constant d31 of about -280 pm V-1 and Young's modulus of about 63 GPa. The measured electromechanical properties of the PZT thick films were comparable to those of the corresponding bulk ceramics. This approach makes it possible to obtain high-quality PZT films because it separates the PZT wafer fabrication from the target substrate and consequently allows integration of the PZT thick films onto many kinds of substrates. Finally, a self-sensing bulk PZT thick film actuator was fabricated as an example of a basic PZT-Si diaphragm structure that can be used in piezoelectric micropumps, and its sensing and actuating performances were also demonstrated.

  10. Manual for target thickness measurement by alpha particle irradiation

    International Nuclear Information System (INIS)

    Dias, J.F.; Martins, M.N.

    1990-04-01

    A system is described for thin-target thickness measurement through the alpha particle energy loss when them traverse the target. It is also described the program used in the analysis of the target thickness. (L.C.) [pt

  11. The effect of Cr buffer layer thickness on voltage generation of thin-film thermoelectric modules

    International Nuclear Information System (INIS)

    Mizoshiri, Mizue; Mikami, Masashi; Ozaki, Kimihiro

    2013-01-01

    The effect of Cr buffer layer thickness on the open-circuit voltage generated by thin-film thermoelectric modules of Bi 0.5 Sb 1.5 Te 3 (p-type) and Bi 2 Te 2.7 Se 0.3 (n-type) materials was investigated. A Cr buffer layer, whose thickness generally needs to be optimized to improve adhesion depending on the substrate surface condition, such as roughness, was deposited between thermoelectric thin films and glass substrates. When the Cr buffer layer was 1 nm thick, the Seebeck coefficients and electrical conductivity of 1 µm thermoelectric thin films with the buffer layers were approximately equal to those of the thermoelectric films without the buffer layers. When the thickness of the Cr buffer layer was 1 µm, the same as the thermoelectric films, the Seebeck coefficients of the bilayer films were reduced by an electrical current flowing inside the Cr buffer layer and the generation of Cr 2 Te 3 . The open-circuit voltage of the thin-film thermoelectric modules decreased with an increase in the thickness of the Cr buffer layer, which was primarily induced by the electrical current flow. The reduction caused by the Cr 2 Te 3 generation was less than 10% of the total voltage generation of the modules without the Cr buffer layers. The voltage generation of thin-film thermoelectric modules could be controlled by the Cr buffer layer thickness. (paper)

  12. Thickness control in electrophoretic deposition of WO3 nanofiber thin films for solar water splitting

    International Nuclear Information System (INIS)

    Fang, Yuanxing; Lee, Wei Cheat; Canciani, Giacomo E.; Draper, Thomas C.; Al-Bawi, Zainab F.; Bedi, Jasbir S.; Perry, Christopher C.; Chen, Qiao

    2015-01-01

    Graphical abstract: - Highlights: • A novel method combining electrospinning and electrophoretic deposition was established for the creation of nanostructured semiconductor thin films. • The created thin films displayed a high chemical stability with a controllable thickness. • The PEC water splitting performance of the thin films was optimized by fine-tuning the thickness of the films. • A maximum photoconversion efficiency was achieved by 18 μm nanofibrous thin films. - Abstract: Electrophoretic deposition (EPD) of ground electrospun WO 3 nanofibers was applied to create photoanodes with controlled morphology for the application of photoelectrochemical (PEC) water splitting. The correlations between deposition parameters and film thicknesses were investigated with theoretical models to precisely control the morphology of the nanostructured porous thin film. The photoconversion efficiency was further optimized as a function of film thickness. A maximum photoconversion efficiency of 0.924% from electrospun WO 3 nanofibers that EPD deposited on a substrate was achieved at a film thickness of 18 μm.

  13. Influence of Thickness on Ethanol Sensing Characteristics of Doctor-bladed Thick Film from Flame-made ZnO Nanoparticles

    Directory of Open Access Journals (Sweden)

    Sukon Phanichphant

    2007-02-01

    Full Text Available ZnO nanoparticles were produced by flame spray pyrolysis (FSP using zincnaphthenate as a precursor dissolved in toluene/acetonitrile (80/20 vol%. The particleproperties were analyzed by XRD, BET, and HR-TEM. The sensing films were produced bymixing the particles into an organic paste composed of terpineol and ethyl cellulose as avehicle binder and were fabricated by doctor-blade technique with various thicknesses (5,10, 15 μm. The morphology of the sensing films was analyzed by SEM and EDS analyses.The gas sensing characteristics to ethanol (25-250 ppm were evaluated as a function of filmthickness at 400°C in dry air. The relationship between thickness and ethanol sensingcharacteristics of ZnO thick film on Al2O3 substrate interdigitated with Au electrodes wereinvestigated. The effects of film thickness, as well as the cracking phenomenon, though,many cracks were observed for thicker sensing films. Crack widths increased withincreasing film thickness. The film thickness, cracking and ethanol concentration havesignificant effect on the sensing characteristics. The sensing characteristics with variousthicknesses were compared, showing the tendency of the sensitivity to ethanol decreasedwith increasing film thickness and response time. The relationship between gas sensingproperties and film thickness was discussed on the basis of diffusively and reactivity of thegases inside the oxide films. The thinnest sensing film (5 μm showed the highest sensitivityand the fastest response time (within seconds.

  14. Electro-Physical Technique for Post-Fabrication Measurements of CMOS Process Layer Thicknesses.

    Science.gov (United States)

    Marshall, Janet C; Vernier, P Thomas

    2007-01-01

    This paper presents a combined physical and electrical post-fabrication method for determining the thicknesses of the various layers in a commercial 1.5 μm complementary-metal-oxide-semiconductor (CMOS) foundry process available through MOSIS. Forty-two thickness values are obtained from physical step-height measurements performed on thickness test structures and from electrical measurements of capacitances, sheet resistances, and resistivities. Appropriate expressions, numeric values, and uncertainties for each layer of thickness are presented, along with a systematic nomenclature for interconnect and dielectric thicknesses. However, apparent inconsistencies between several of the physical and electrical results for film thickness suggest that further uncertainty analysis is required and the effects of several assumptions need to be quantified.

  15. Nanomechanical testing of circular freestanding polymer films with sub-micron thickness

    International Nuclear Information System (INIS)

    Maner, Kyle C.; Begley, Matthew R.; Oliver, Warren C.

    2004-01-01

    This paper describes techniques to create freestanding films over perfectly circular spans (windows) and measure their mechanical properties using instrumented nanoindentation. Test samples were created by spin-casting polymer films over glass plates with embedded fibers, which were subsequently etched using a relatively weak acid to leave freestanding circular spans. The freestanding spans were tested using an instrumented nanoindenter over a wide range of applied loads and displacements. Material properties can be extracted from measured load-deflection responses using straightforward models for point-loads on circular plates or membranes. Results are presented for poly(methyl methacrylate) and poly(2,6,dimethyl,1,4,phenylene ether) films with thickness ranging from 350 to 750 nm. The properties derived from freestanding tests are compared with traditional nanoindentation of films on intact substrates. The freestanding approach has key advantages for characterizing micron-scale behavior of compliant materials, notably greater ease and applicability of sample preparation over other micro-fabrication techniques and straightforward analytical or numerical models

  16. Thick film nickel plating - the alternative. Long-term experiences; Dickschichtvernickelung - die Alternative. Langzeiterfahrungen

    Energy Technology Data Exchange (ETDEWEB)

    Senff-Wollenberg, Ralf [Baumgarte Boiler Systems GmbH, Bielefeld (Germany). Technik; Ansey, Johann-Wilhelm [Baumgarte Boiler Systems GmbH, Bielefeld (Germany). Forschung und Entwicklung; Reinmoeller, Frank [Baumgarte Boiler Systems GmbH, Bielefeld (Germany)

    2013-03-01

    The ecologic and energetic demands on modern plants fort he thermal utilization of waste materials increase continuously. Beside low costs of investment, enhanced efficiencies, an enhanced availability, long journey times as well as low costs of operation and maintenance are important factors for the investment decision. The primary and secondary measures for the shrinkage of corrosion are decisive for achieving the factors for the decision of investment and maintenance. The authors of the contribution under consideration report on long-term experiences on the thick film nickel plating. Especially, the process of galvanic nickel plating, the fields of application as well as the operational experiences are described.

  17. Thickness Dependence of Buckling Patterns of Ta Films Sputtered on Glass Substrates

    Science.gov (United States)

    Zhang, Yong-Ju; Yu, Sen-Jiang; Zhou, Hong; Chen, Miao-Gen; Jiao, Zhi-Wei

    2012-06-01

    Tantalum (Ta) films deposited on glass substrates have been prepared by a direct current magnetron sputtering method, and buckling patterns induced by residual compressive stress are investigated in detail. When the film thickness increases, the buckling morphologies evolve from straight-sided buckle network to wavy or wormlike wrinkles gradually, and finally change into telephone cord buckles. The geometrical parameters of the buckling patterns are found to increase linearly with the film thickness. Based on the geometrical parameters of the buckling patterns, the mechanical properties of the Ta films are also discussed in the frame of continuum elastic theory.

  18. Wet Chemical Synthesis and Screening of Thick Porous Oxide Films for Resistive Gas Sensing Applications

    Directory of Open Access Journals (Sweden)

    Wilhelm F. Maier

    2006-11-01

    Full Text Available A method of wet chemical synthesis suitable for high throughput and combinatorial applications has been developed for the synthesis of porous resistive thick-film gas sensors. This method is based on the robot-controlled application of unstable metal oxide suspensions on an array of 64 inter-digital electrodes positioned on an Al2O3 substrate. SnO2, WO3, ZrO2, TiO2, CeO2, In2O3 and Bi2O3 were chosen as base oxides, and were optimised by doping or mixed oxide formation. The parallel synthesis of mixed oxide sensors is illustrated by representative examples. The electrical characteristics and the sensor performance of the films were measured by high-throughput impedance spectroscopy while supplying various test gases (H2, CO, NO, NO2, propene. Data collection, data mining techniques applied and the best potential sensor materials discovered are presented.

  19. Comparison of functional parameters of CsI:Tl crystals and thick films

    International Nuclear Information System (INIS)

    Fedorov, A.; Gektin, A.; Lebedynskiy, A.; Mateychenko, P.; Shkoropatenko, A.

    2013-01-01

    500 mkm thick CsI:Tl columnar films can be produced using thermal evaporation in vacuum by sublimation of the same bulk crystal. Comparison of afterglow and radiation stability of deposited CsI:Tl films with source crystal was the aim of current work. It is shown that the afterglow in the films is always below its level in initial single crystal. It was ascertained that the annealing atmospheres influence the processes leading to the activator depletion of the films during the thermal processing. -- Highlights: ► Thick CsI:Tl columnar films were obtained by thermal evaporation in vacuum. ► Radiation stability of such CsI:Tl films appears to be better than that of crystal. ► CsI:Tl film parameters can be modified by annealing in different atmospheres

  20. Relation between film thickness and surface doping of MoS2 based field effect transistors

    Science.gov (United States)

    Lockhart de la Rosa, César J.; Arutchelvan, Goutham; Leonhardt, Alessandra; Huyghebaert, Cedric; Radu, Iuliana; Heyns, Marc; De Gendt, Stefan

    2018-05-01

    Ultra-thin MoS2 film doping through surface functionalization with physically adsorbed species is of great interest due to its ability to dope the film without reduction in the carrier mobility. However, there is a need for understanding how the thickness of the MoS2 film is related to the induced surface doping for improved electrical performance. In this work, we report on the relation of MoS2 film thickness with the doping effect induced by the n-dopant adsorbate poly(vinyl-alcohol). Field effect transistors built using MoS2 films of different thicknesses were electrically characterized, and it was observed that the ION/OFF ratio after doping in thin films is more than four orders of magnitudes greater when compared with thick films. Additionally, a semi-classical model tuned with the experimental devices was used to understand the spatial distribution of charge in the channel and explain the observed behavior. From the simulation results, it was revealed that the two-dimensional carrier density induced by the adsorbate is distributed rather uniformly along the complete channel for thin films (<5.2 nm) contrary to what happens for thicker films.

  1. Revisited the mathematical derivation wall thickness measurement of pipe for radiography

    Energy Technology Data Exchange (ETDEWEB)

    Hamzah, A.R.; Amir, S.M.M. [Non Destructive Testing(NDT) Group, Industrial Technology Div., Malaysian Nuclear Agency, Selangor (Malaysia)

    2007-07-01

    Wall thickness measurement of pipe is very important of the structural integrity of the industrial plant. However, the radiography method has an advantage because the ability of penetrating the insulated pipe. This will have economic benefit for industry. Moreover, the era of digital radiography has more advantages because the speed of radiographic work, less exposure time and no chemical used for film development. Either the conventional radiography or digital radiology, the wall thickness measurement is using the tangential radiography technique (TRT). In case, of a large diameter, pipe (more than inches) the determination maximum penetration wall thickness must be taken into the consideration. This paper is revisited the mathematical derivation of the determination of wall thickness measurement based on tangential radiography technique (TRT). The mathematical approach used in this derivation is the Pythagoras theorem and geometrical principles. In order to derive the maximum penetration wall thickness a similar approach is used. (authors)

  2. Investigation of the correlation between dielectric function, thickness and morphology of nano-granular ZnO very thin films

    Energy Technology Data Exchange (ETDEWEB)

    Gilliot, Mickaël, E-mail: mickael.gilliot@univ-reims.fr [Laboratoire d' Ingénierie et Sciences des Matériaux, Université de Reims Champagne-Ardenne (France); Hadjadj, Aomar [Laboratoire d' Ingénierie et Sciences des Matériaux, Université de Reims Champagne-Ardenne (France); Martin, Jérôme [Laboratoire de Nanotechnologie et d' Instrumentation Optique, Université de Technologie de Troyes (France)

    2015-12-31

    Thin nano-granular ZnO layers were prepared using a sol–gel synthesis and spin-coating deposition process with a thickness ranging between 20 and 120 nm. The complex dielectric function (ϵ) of the ZnO film was determined from spectroscopic ellipsometry measurements. Up to a critical thickness close to 60 nm, the magnitude of both the real and the imaginary parts of ϵ rapidly increases and then slowly tends to values closer to the bulk ZnO material. This trend suggests a drastic change in the film porosity at both sides of this critical thickness, due to the pre-heating and post-crystallization processes, as confirmed by additional characterization of the structure and the morphology of the ZnO films. - Highlights: • c-Axis oriented ZnO thin films were grown with different morphological states. • The morphology and structures are controlled by controlling the thickness. • The optical properties are correlated to morphological evolution. • Two growth behaviors and property evolutions are identified around a critical thickness.

  3. Study of nanosized copper-doped ZnO dilute magnetic semiconductor thick films for spintronic device applications

    Science.gov (United States)

    Zargar, Rayees Ahmad; Arora, Manju; Bhat, Riyaz Ahmed

    2018-01-01

    Screen-printed pure and copper-doped ZnO dilute magnetic semiconductor thick films were casted from chemically co-precipitated zinc oxide and copper-doped zinc oxide nanoparticles followed by sintering at 550 °C to obtain desired stoichiometry in spintronic device applications. These thick films were characterized by different analytical techniques to reveal their structure, surface morphology, optical, magnetic and electrical characteristics. The diffraction peaks pertaining to wurtzite structure are observed in XRD patterns of these films, while SEM images show smooth and dense morphology. Infrared transmission and Raman spectra exhibit vibrational bands pertaining to Zn-O-stretching modes and E 2 (high) phonon mode, respectively, in 4000-400 cm-1 region. The direct bandgap energy of these films derived from diffused reflectance spectroscopy varies in 3.21-3.13 eV range and is supported by PL spectroscopy study. The semiconducting behaviour and activation energy of these thick films has been confirmed by DC conductivity measurements. Electron paramagnetic resonance spectra showed derivative signal of g value 2.0018 in pure ZnO due to oxygen vacancies produced during synthesis and 2.0704 in copper-doped ZnO dilute magnetic semiconductor films.

  4. Analysis of pulsed laser deposited amorphous chalcogenide film thickness distribution: Plume deflection angle dependence

    OpenAIRE

    Pavlišta , Martin; Zajac , Vit; Nazabal , Virginie; Gutwirth , Jan; Gouttefangeas , Francis; Němec , Petr

    2018-01-01

    International audience; Pulsed laser deposition exploiting a KrF excimer laser was used to fabricate amorphous As-S thin films from bulk As2S3 glass target. Thickness profile of the film was extracted from variable angle spectroscopic ellipsometry data. The dependence of thickness distribution of prepared thin layer on laser beam plume deflection angle was evaluated and corresponding equations were suggested.

  5. Dual-angle, spectral reconstruction imaging method for the determination of dielectric thin-film thickness.

    Science.gov (United States)

    Kruschwitz, Jennifer D T; Berns, Roy S

    2017-08-01

    The thickness of optical thin films, such as dielectrics, can be determined by the use of a profilometer or by a spectrophotometer. Both of these standard methods have coated area size limitations. Converting a digital camera to a spectrophotometer eliminates these size limitations. This work reviews a simple method for determining the physical thickness of a dielectric film on a silicon wafer using two images from a digital camera.

  6. Pelvic floor muscle thickness measured by perineal ultrasonography

    DEFF Research Database (Denmark)

    Bernstein, Inge Thomsen; Juul, N; Grønvall, S

    1991-01-01

    Pelvic floor muscle thickness was assessed in nine healthy female physiotherapists by perineal sonography. All measurements were performed as triple-measurements. The aims were to assess the reliability of the measurements and to establish a reference material. The muscle thickness at rest...

  7. Radiographic technique and brackets affect measurements of proximal enamel thickness on mandibular incisors

    NARCIS (Netherlands)

    Ang, Amy Giok Phing; Steegmans, Pauline Antoinette Josephine; Kerdijk, Wouter; Livas, Christos; Ren, Yijin

    2017-01-01

    Objective: To investigate the influence of radiographic film and tube positioning, the presence and the size of brackets on in vitro measurements of proximal enamel thickness of mandibular incisors on periapical radiographs aimed to aid planning of interproximal enamel reduction procedures in

  8. Structure, surface morphology and electrical properties of evaporated Ni thin films: Effect of substrates, thickness and Cu underlayer

    International Nuclear Information System (INIS)

    Hemmous, M.; Layadi, A.; Guittoum, A.; Souami, N.; Mebarki, M.; Menni, N.

    2014-01-01

    Series of Ni thin films have been deposited by thermal evaporation onto glass, Si(111), Cu, mica and Al 2 O 3 substrates with and without a Cu underlayer. The Ni thicknesses, t, are in the 4 to 163 nm range. The Cu underlayer has also been evaporated with a Cu thickness equal to 27, 52 and 90 nm. The effects of substrate, the Ni thickness and the Cu underlayer on the structural and electrical properties of Ni are investigated. Rutherford Backscattering Spectroscopy was used to probe the Ni/Substrate and Ni–Cu underlayer interfaces and to measure both Ni and Cu thicknesses. The texture, the strain and the grain size values were derived from X-ray diffraction experiments. The surface morphology is studied by means of a Scanning Electron Microscope. The electrical resistivity is measured by the four point probe. The Ni films grow with the <111> texture on all substrates. The Ni grain sizes D increase with increasing thickness for the glass, Si and mica substrates and decrease for the Cu one. The strain ε is positive for low thickness, decreases in magnitude and becomes negative as t increases. With the Cu underlayer, the growth mode goes through two phases: first, the stress (grain size) increases (decreases) up to a critical thickness t Cr , then stress is relieved and grain size increases. All these results will be discussed and correlated. - Highlights: • The structural and electrical properties of evaporated Ni thin films are studied. • The effect of thickness, substrates and Cu underlayer is investigated. • Texture, grain size, strain and surface morphology are discussed. • Growth modes are described as a function of Ni thickness

  9. Thickness dependence of magnetic properties in La–Co substituted strontium hexaferrite films with perpendicular anisotropy

    Energy Technology Data Exchange (ETDEWEB)

    Hui, Yajuan [School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan 430074 (China); Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan 430074 (China); Cheng, Weiming, E-mail: wmcheng@mail.hust.edu.cn [School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan 430074 (China); Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan 430074 (China); Yan, Peng [School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan 430074 (China); Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan 430074 (China); Chen, Jincai [Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan 430074 (China); Miao, Xiangshui [School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan 430074 (China); Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan 430074 (China); Wuhan National High Magnetic Field Center, Huazhong University of Science and Technology, Wuhan 430074 (China)

    2015-09-15

    The thickness dependence of magnetization reversal and coercivity behavior for La–Co substituted strontium hexaferrite (Sr-M) films was investigated. It is found that perpendicular anisotropy appears only when film thickness (t) is above 110 nm. With increasing t, perpendicular anisotropy energy (K{sub u⊥}) increases gradually to its maximum of 1.76×10{sup 6} erg/cm{sup 3} at t=300 nm, but turns to decrease when t>300 nm. Moreover, when t>110 nm, those films exhibit domains pinning or Stoner–Wohlfarth reversal model, present large K{sub u⊥} values and a rapid increase in H{sub c⊥}. However, while t≤110 nm, Sr-M films show nucleation model of magnetization reversal and perform low coercivity. The origin of the coercivity varying with thickness should be correlated with the grain size and preferred orientations in Sr-M films. - Highlights: • Thickness dependence in submicro-scale bulk system is investigated for La–Sr–Co–Fe–O films. • (0 0 1) preferred orientation gradually increases until t=300 nm and then declines. • The magnetization reversal presents different models with thickness. • Perpendicular anisotropy energy increases to maximum value of 1.76×10{sup 6} erg/cm{sup 3} at t=300 nm. • The coercivity varying with thickness is correlated with the grain size and preferred orientation.

  10. The effect of Argon ion irradiation on the thickness and structure of ultrathin amorphous carbon films

    Energy Technology Data Exchange (ETDEWEB)

    Xie, J.; Komvopoulos, K., E-mail: kyriakos@me.berkeley.edu [Department of Mechanical Engineering, University of California, Berkeley, California 94720 (United States)

    2016-03-07

    Carbon films synthesized by plasma-enhanced chemical vapor deposition (PECVD) and filtered cathodic vacuum arc (FCVA) exhibit a layered structure consisting of a bottom (interface) and a top (surface) layer rich in sp{sup 2} atomic carbon bonding and a middle (bulk) layer of much higher sp{sup 3} content. Because of significant differences in the composition, structure, and thickness of these layers, decreasing the film thickness may negatively affect its properties. In this study, transmission electron microscopy (TEM) and electron energy loss spectroscopy (EELS) were used to examine the effect of Ar{sup +} ion irradiation on the structure and thickness of ultrathin films of hydrogenated amorphous carbon (a-C:H) and hydrogen-free amorphous carbon (a-C) deposited by PECVD and FCVA, respectively. The TEM and EELS results show that 2-min ion irradiation decreases the film thickness without markedly changing the film structure and composition, whereas 4-min ion irradiation results in significant film thinning and a moderate decrease of the sp{sup 3} content of the bulk layer. This study demonstrates that Ar{sup +} ion irradiation is an effective post-deposition process for reducing the thickness and tuning the structure of ultrathin carbon films. This capability has direct implications in the synthesis of ultrathin protective carbon overcoats for extremely high-density magnetic recording applications.

  11. Nanostructured SnO2 thick films for gas sensor application: analysis of structural and electronic properties

    Science.gov (United States)

    Miskovic, Goran; Aleksic, Obrad S.; Nikolic, Maria V.; Nicolics, Johann; Radosavljevic, Goran; Vasiljevic, Zorka Z.; Lukovic, Miloljub D.; Smetana, Walter

    2016-03-01

    This research is focused on structural and electrical characterisation of tin oxide (SnO2) applied as a thick film and investigation of its properties as gas sensitive material. Micron sized SnO2 powder was milled in an agate mill for six hours to fabricate SnO2 nanopowder, which was afterwards sieved by 325 mesh sieve and characterized by XRD and SEM. This powder was used as functional part in the production of thick film tin oxide paste containing a resin vehicle with 4 wt. % nanosize glass frits acting as permanent binder. The glass frits where additionally milled for twelve hours in the agate mills to nanosized powder and sieved by a 325 mesh sieve as well. The achieved thick film paste was screen printed on alumina and fired at 850oC peak temperature for 10 minutes in air. After the sintering process, thick film samples where characterized by X-ray powder diffraction (XRD) and scanning electron microscopy (SEM). The reflectivity was measured on the same samples by UV-VIS spectrophotometer: the band gap was determined from the slope of reflectance. After that a matrix of different interdigitated electrode structure of PdAg paste was printed and sintered using the mentioned sintering conditions. The tin oxide thick film was printed over the interdigitated electrodes as a top layer and sintered again under the same conditions. The total electrical resistance was measured as a function of the electrode spacing and temperature. A negative temperature coefficient (NTC) was identified and measured in the range from room temperature (27°C) to 180°C in a climate chamber. Finally the samples were placed into a gas reactor with NOx and CO gas and the resistance was measured in the same temperature range (27°C-200°C).

  12. Effect of thickness on the electrical and optical properties of epitaxial (La0.07Ba0.93)SnO3 thin films

    Science.gov (United States)

    Liu, Qinzhuang; Jin, Feng; Dai, Jianming; Li, Bing; Geng, Lei; Liu, Jianjun

    2016-08-01

    Transparent conductive oxide (La0.07Ba0.93)SnO3 (LBSO) thin films with thickness ranged from 220 nm to 11 nm were epitaxially grown on MgO substrate by pulsed laser deposition. The effect of thickness on the structural, transport, and optical properties of LBSO thin films was investigated in detail. With the film thickness decreasing, x-ray diffraction characterizations show that the LBSO (002) diffraction peak has no obvious shift, but the values of the full width at half maximum increase gradually from 0.608° to 1.136° due to the deterioration of crystalline quality of LBSO films. Atomic force microcopy reveals that the root-mean-square surface roughness of LBSO films decreases from 3.93 to 0.268 nm with film thickness decreasing. The lowest resistivity value of 1.181 × 10-4 Ωcm at room temperature was observed in 220 nm thick films, with the highest carrier mobility of 41.06 cm2 V-1 s-1 and carrier concentration of 8.377 × 1020 cm-3. Furthermore, the resistivity increases gradually with the decrease of LBSO film thickness. Temperature dependent resistivity measurements indicate that the metal-semiconductor transition temperature of LBSO thin film changes regularly with the film thickness. The optical band gap of LBSO thin film decreases from 4.58 to 3.55 eV with decreasing the thickness, which was explained by the Burstein-Moss effect.

  13. Correlation of thickness and magnetization in LCMO film

    Indian Academy of Sciences (India)

    tion under FC and ZFC conditions may be due to strain-induced anisotropy arising from the lattice mismatch between the substrate and the film or due to the shape anisotropy due to epitaxial growth. Keywords. Colossal magnetoresistance; manganite; thin film; La. 0.67. Mn0.33MnO3. PACS Nos 75.30.Gw; 75.70.-i; 75.30.Vn.

  14. Quantifying Local Thickness and Composition in Thin Films of Organic Photovoltaic Blends by Raman Scattering

    KAUST Repository

    Rodríguez-Martínez, Xabier

    2017-07-06

    We report a methodology based on Raman spectroscopy that enables the non-invasive and fast quantitative determination of local thickness and composition in thin films (from few monolayers to hundreds of nm) of one or more components. We apply our methodology to blends of organic conjugated materials relevant in the field of organic photovoltaics. As a first step, we exploit the transfer-matrix formalism to describe the Raman process in thin films including reabsorption and interference effects of the incoming and scattered electric fields. This allows determining the effective solid-state Raman cross-section of each material by studying the dependence of the Raman intensity on film thickness. These effective cross sections are then used to estimate the local thickness and composition in a series of polymer:fullerene blends. We find that the model is accurate within ±10 nm in thickness and ±5 vol% in composition provided that (i) the film thickness is kept below the thickness corresponding to the first maximum of the calculated Raman intensity oscillation; (ii) the materials making up the blend show close enough effective Raman cross-sections; and (iii) the degree of order attained by the conjugated polymer in the blend is similar to that achieved when cast alone. Our methodology opens the possibility to make quantitative maps of composition and thickness over large areas (from microns to centimetres squared) with diffraction-limited resolution and in any multi-component system based thin film technology.

  15. Thickness measurement by using cepstrum ultrasonic signal processing

    International Nuclear Information System (INIS)

    Choi, Young Chul; Yoon, Chan Hoon; Choi, Heui Joo; Park, Jong Sun

    2014-01-01

    Ultrasonic thickness measurement is a non-destructive method to measure the local thickness of a solid element, based on the time taken for an ultrasound wave to return to the surface. When an element is very thin, it is difficult to measure thickness with the conventional ultrasonic thickness method. This is because the method measures the time delay by using the peak of a pulse, and the pulses overlap. To solve this problem, we propose a method for measuring thickness by using the power cepstrum and the minimum variance cepstrum. Because the cepstrums processing can divides the ultrasound into an impulse train and transfer function, where the period of the impulse train is the traversal time, the thickness can be measured exactly. To verify the proposed method, we performed experiments with steel and, acrylic plates of variable thickness. The conventional method is not able to estimate the thickness, because of the overlapping pulses. However, the cepstrum ultrasonic signal processing that divides a pulse into an impulse and a transfer function can measure the thickness exactly.

  16. Study of β-phase development in spin-coated PVDF thick films

    Indian Academy of Sciences (India)

    2017-06-09

    Jun 9, 2017 ... Abstract. A study was conducted to ascertain the effect of variation in spin speed and baking temperature on β-phase content in the spin-coated poly(vinylidene fluoride) (PVDF) thick films (∼4−25 μm). Development of β-phase is dependent on film stretching and crystallization temperature. Therefore, to ...

  17. Investigation of Top/bottom Electrode and Diffusion Barrier Layer for PZT thick film MEMS Sensors

    DEFF Research Database (Denmark)

    Pedersen, Thomas; Hindrichsen, Christian Carstensen; Lou-Møller, R.

    2007-01-01

    In this work screen printed piezoelectric Ferroperm PZ26 lead zirconate titanate (PZT) thick film is used for two MEMS devices. A test structure is used to investigate several aspects regarding bottom and top electrodes. 450 nm ZrO2 thin film is found to be an insufficient diffusion barrier layer...

  18. Study of β-phase development in spin-coated PVDF thick films

    Indian Academy of Sciences (India)

    A study was conducted to ascertain the effect of variation in spin speed and baking temperature on β -phase content in the spin-coated poly(vinylidene fluoride) (PVDF) thick films ( ∼ 4−25 μ m). Development of β -phase is dependent on film stretching and crystallization temperature. Therefore, to study the development of β ...

  19. Superconducting YBaCuO_3 thick film (T,(0)= 92 K) on a newly ...

    Indian Academy of Sciences (India)

    Cu3O7– superconducting film has been developed. The dielectric constant and loss factor values of the material are in the range suitable for its use as substrate for microwave application. A YBa2Cu3O7– superconducting thick film dip ...

  20. Finite-element analysis of the deformation of thin Mylar films due to measurement forces.

    Energy Technology Data Exchange (ETDEWEB)

    Baker, Michael Sean; Robinson, Alex Lockwood; Tran, Hy D.

    2012-01-01

    Significant deformation of thin films occurs when measuring thickness by mechanical means. This source of measurement error can lead to underestimating film thickness if proper corrections are not made. Analytical solutions exist for Hertzian contact deformation, but these solutions assume relatively large geometries. If the film being measured is thin, the analytical Hertzian assumptions are not appropriate. ANSYS is used to model the contact deformation of a 48 gauge Mylar film under bearing load, supported by a stiffer material. Simulation results are presented and compared to other correction estimates. Ideal, semi-infinite, and constrained properties of the film and the measurement tools are considered.

  1. Refractive index and geometrical thickness measurement of a transparent pellicle in air by Gaussian beam defocusing.

    Science.gov (United States)

    Olvera-R, Octavio; Cywiak, Moisés; Cervantes-L, Joel; Morales, Arquímedes

    2014-04-10

    We demonstrate that it is possible to measure the local geometrical thickness and the refractive index of a transparent pellicle in air by combining the diffractive properties of a Gaussian beam with the analytical equations of the light that propagates through a thin layer. We show that our measurement technique is immune to inherent piston-like vibrations present in the pellicle. As our measurements are based on characterizing properly the Gaussian beam in a plane of detection, a homodyne technique for this purpose is devised and described. The feasibility of our proposal is confirmed by measuring local geometrical thicknesses and the refractive index of a commercially available stretch film.

  2. THICKNESS DEPENDENCE OF BUCKLING PATTERNS OF Ta FILMS SPUTTERED ON GLASS SUBSTRATES

    OpenAIRE

    YONG-JU ZHANG; SEN-JIANG YU; HONG ZHOU; MIAO-GEN CHEN; ZHI-WEI JIAO

    2012-01-01

    Tantalum (Ta) films deposited on glass substrates have been prepared by a direct current magnetron sputtering method, and buckling patterns induced by residual compressive stress are investigated in detail. When the film thickness increases, the buckling morphologies evolve from straight-sided buckle network to wavy or wormlike wrinkles gradually, and finally change into telephone cord buckles. The geometrical parameters of the buckling patterns are found to increase linearly with the film th...

  3. Physicochemical controls on absorbed water film thickness in unsaturated geological media

    Energy Technology Data Exchange (ETDEWEB)

    Tokunaga, T.

    2011-06-14

    Adsorbed water films commonly coat mineral surfaces in unsaturated soils and rocks, reducing flow and transport rates. Therefore, it is important to understand how adsorbed film thickness depends on matric potential, surface chemistry, and solution chemistry. Here, the problem of adsorbed water film thickness is examined through combining capillary scaling with the Derjaguin-Landau-Verwey-Overbeek (DLVO) theory. Novel aspects of this analysis include determining capillary influences on film thicknesses, and incorporating solution chemistry-dependent electrostatic potential at air-water interfaces. Capillary analysis of monodisperse packings of spherical grains provided estimated ranges of matric potentials where adsorbed films are stable, and showed that pendular rings within drained porous media retain most of the 'residual' water except under very low matric potentials. Within drained pores, capillary contributions to thinning of adsorbed films on spherical grains are shown to be small, such that DLVO calculations for flat surfaces are suitable approximations. Hamaker constants of common soil minerals were obtained to determine ranges of the dispersion component to matric potential-dependent film thickness. The pressure component associated with electrical double layer forces was estimated using the compression and linear superposition approximations. The pH-dependent electrical double layer pressure component is the dominant contribution to film thicknesses at intermediate values of matric potential, especially in lower ionic strength solutions (< 10 mol m{sup -3}) on surfaces with higher magnitude electrostatic potentials (more negative than - 50 mV). Adsorbed water films are predicted to usually range in thickness from 1 to 20 nm in drained pores and fractures of unsaturated environments.

  4. Thickness measurement of A-1 reactor caisson tube walls

    International Nuclear Information System (INIS)

    Prepechal, J.; Sladky, J.

    1974-01-01

    The equipment is described of measuring the thickness of caisson pipes built in the Bohunice A-1 reactor. The pulse-type ultrasonic thickness gauge is based on the reflection method using the double probe. The measurement accuracy is 0.1 mm. (J.B.)

  5. Annealing and thickness effects on magnetic properties of Co2FeAl alloy films

    Science.gov (United States)

    Wang, Ke; Xu, Zhan; Ling, Fujin; Wang, Yahong; Dong, Shuo

    2018-03-01

    Co2FeAl (CFA) films in a wide thickness range between 2 and 100 nm are sputtered at room temperature. Perpendicular magnetic anisotropy (PMA) is achieved in the annealed structure of Pd/CFA/MgO with CFA thickness ranging between 2.3 and 4.9 nm. PMA as high as 2 × 106 erg/cm3 is demonstrated in the structures annealed in the temperature range between 300 and 350 °C. Positive contributions to the PMA made by the interfaces of Pd/CFA and CFA/MgO are identified. For the as-deposited structure of MgO/CFA/Ta with thick CFA alloy up to 5 nm or above a high effective saturation magnetization of 983.9 ± 30.1 emu/cc is derived from the fitting and an in-plane uniaxial magnetic anisotropy of 104 erg/cm3 in magnitude is revealed by angular dependent magnetic measurements. In addition to the increase in saturation magnetization, a fourfold cubic magnetic anisotropy is found to develop with annealing, in line with the improvement of the crystalline structure confirmed by X-ray diffraction measurements. Out results provide some useful information for the design of the CFA-based magnetoelectronic devices.

  6. Spacer Thickness-Dependent Electron Transport Performance of Titanium Dioxide Thick Film for Dye-Sensitized Solar Cells

    Directory of Open Access Journals (Sweden)

    Reda E. El-Shater

    2015-01-01

    Full Text Available A titanium dioxide (P25 film was deposited by cast coating as conductive photoelectrode and subsequently immersed in dye solution (N719 to fabricate the photoanode of dye-sensitized solar cells (DSSCs. A plastic spacer was used as a separation and sealant layer between the photoanode and the counter electrode. The effect of the thickness of this spacer on the transfer of electrons in the liquid electrolyte of the DSSCs was studied by means of both IV curves and electrochemical impedance. Using a spacer thickness range of 20 μm to 50 μm, efficiency ranges from 3.73% to 7.22%. The highest efficiency of 7.22% was obtained with an optimal spacer thickness of 40 μm.

  7. Optimizing diode thickness for thin-film solid state thermal neutron detectors

    Energy Technology Data Exchange (ETDEWEB)

    Murphy, John W.; Mejia, Israel; Quevedo-Lopez, Manuel A.; Gnade, Bruce [Department of Materials and Science, University of Texas at Dallas, Richardson, Texas 75080 (United States); Kunnen, George R.; Allee, David [Flexible Display Center at Arizona State University, Tempe, Arizona 85284 (United States)

    2012-10-01

    In this work, we investigate the optimal thickness of a semiconductor diode for thin-film solid state thermal neutron detectors. We evaluate several diode materials, Si, CdTe, GaAs, C (diamond), and ZnO, and two neutron converter materials, {sup 10}B and {sup 6}LiF. Investigating a coplanar diode/converter geometry, we determine the minimum semiconductor thickness needed to achieve maximum neutron detection efficiency. By keeping the semiconductor thickness to a minimum, gamma rejection is kept as high as possible. In this way, we optimize detector performance for different thin-film semiconductor materials.

  8. Orientation and magnetic properties of the thick multilayered [NdFeBxTby]n films

    International Nuclear Information System (INIS)

    Liu, Weifang; Suzuki, Shunji; Machida, Kenichi

    2007-01-01

    Multilayered [NdFeB x /Tb y ] n films were prepared by a three-demensional sputtering system. From the thickness of NdFeB layer dependence on the orientation and magnetic properties of multilayered [NdFeB (xμm)/Tb (50nm)] n films with 7.2μm as a total thickness of NdFeB layers, it was found that the orientation of NdFeB grains was maintained. However, the coercivity was enhanced with decreasing the thickness of each NdFeB thin layer. The (BH) max value of 240kJ/m 3 was obtained on the layered [NdFeB (1.2μm)/Tb (50 nm)] 6 film as an optimal value. For the multilayered [NdFeB (1.2μm)/Tb (50 nm)] n films with various multiple layer sets (n), the coercivity value increased with the film thickness without any deterioration of the c-axis texture and consequently, multilayered NdFeB/Tb film magnets with total thickness values around 70μm showed the superior magnetic properties (H cj approx. = 1360kA/m, I r approx.= 1.05T, and (BH) max approx.= 202kJ/m 3 ). (author)

  9. Anomalous size effect in conductivity of Bi films of small thickness

    International Nuclear Information System (INIS)

    Anopchenko, A.S.; Kashirin, V.Yu.; Komnik, Yu.F.

    1995-01-01

    Experimental data are obtained at helium temperature, which describe the kinetic properties (conductivity, magnetoresistance and Hall coefficient) of Bi films whose thicknesses are within 100-500 A. The small-thickness Bi films display an anomalous size effect- the growing conductivity at decreasing thickness, and pronounced quantum interference effects - weak electron localization and enhancing electron-electron interaction in a disordered system. The information derived on the kinetic properties of the films is used to identify the character of the changes in the electron and hole concentrations and mobilities with a decreasing thickness. The isotropy of the properties in the films plane due to the axial texture has permitted us to use the equations for a conductor with two types of charge carriers. The used kinetic characteristics correctly take into account the contribution of the quantum corrections related to quantum interference. It is found that the concentration of the charge carries increases appreciably (by about two orders of magnitude) as the film thickness decreases to 100 A, which determines the anomalous size effect in the conductivity of the films

  10. Growth of BaTiO3-PVDF composite thick films by using aerosol deposition

    Science.gov (United States)

    Cho, Sung Hwan; Yoon, Young Joon

    2016-01-01

    Barium titanate (BaTiO3)-polyvinylidene fluoride (PVDF) composite thick films were grown by using aerosol deposition at room temperature with BaTiO3 and PVDF powders. To produce a uniform composition in ceramic and polymer composite films, which show a substantial difference in specific gravity, we used PVDF-coated BaTiO3 powders as the starting materials. An examination of the microstructure confirmed that the BaTiO3 were well distributed in the PVDF matrix in the form of a 0 - 3 compound. The crystallite size in the BaTiO3-PVDF composite thick films was 5 ˜ 50 times higher than that in pure BaTiO3 thick films. PVDF plays a role in suppressing the fragmentation of BaTiO3 powder during the aerosol deposition process and in controlling the relative permittivity.

  11. Micro-structuring of thick NdFeB films using high-power plasma etching for magnetic MEMS application

    International Nuclear Information System (INIS)

    Jiang, Yonggang; Fujita, Takayuki; Higuchi, Kohei; Maenaka, Kazusuke; Masaoka, Shingo; Uehara, Minoru

    2011-01-01

    This paper describes the micro-patterning of thick NdFeB magnetic films using a high-power plasma etching method. The effects of RF bias power and gas composition on the selectivity and etching rate are experimentally studied. A maximum etching rate of 60 nm min −1 is achieved with an inductively coupled plasma power of 500 W and a RF bias power of 200 W. A maximum selectivity of 0.26 between hard baked AZP4903 photoresist and NdFeB magnetic films is achieved when volumetric Cl 2 concentration is 2.5%. NdFeB micro-magnets as thick as 4.2 µm are achieved by using AZP4903 photoresist. Magnetic film as thick as 10 µm can be patterned by using SU-8 photoresist with a thickness of 100 µm as the mask. The magnetic property of patterned microstructures is characterized using a vibrating sample magnetometer and the magnetic field distribution is measured using a Hall effect sensor IC. The characterization results indicate that the patterned magnetic microstructures have a high magnetic remanance of 1.0 T, which is comparable to that of the non-patterned NdFeB films.

  12. Zirconium titanate thin film prepared by surface sol-gel process and effects of thickness on dielectric property

    CERN Document Server

    Kim, C H

    2002-01-01

    Single phase of multicomponent oxide ZrTiO sub 4 film could be prepared through surface sol-gel route simply by coating the mixture of 100mM zirconium butoxide and titanium butoxide on Pt/Ti/SiO sub 2 /Si(100) substrate, following pyrolysis at 450 .deg. C, and annealing it at 770 .deg. C. The dielectric constant of the film was reduced as the film thickness decreased due to of the interfacial effects caused by layer/electrode and a few voids inside the multilayer. However, the dielectric property was independent of applied dc bias sweeps voltage (-2 to +2 V). The dielectric constant of bulk film, 31.9, estimated using series-connected capacitor model was independent of film thickness and frequency in the measurement range, but theoretical interfacial thickness, t sub i , was dependent on the frequency. It reached a saturated t sub i value, 6.9 A, at high frequency by extraction of some capacitance component formed at low frequency range. The dielectric constant of bulk ZrTiO sub 4 pellet-shaped material was 3...

  13. Room-Temperature Synthesis of Carbonaceous Films of Defined Thickness

    Czech Academy of Sciences Publication Activity Database

    Kavan, Ladislav; Micka, Karel; Hlavatý, Jaromír

    2004-01-01

    Roč. 16, - (2004), s. 4043-4049 ISSN 0897-4756 R&D Projects: GA AV ČR IAA4040306; GA AV ČR KSK4040110 Keywords : carbonaceous films * liquid amalgam * alkali metal Subject RIV: CF - Physical ; Theoretical Chemistry Impact factor: 4.103, year: 2004

  14. Humidity sensing properties of WO{sub 3} thick film resistor prepared by screen printing technique

    Energy Technology Data Exchange (ETDEWEB)

    Garde, Arun S, E-mail: arungarde@yahoo.co.in

    2014-12-25

    Highlights: • Polycrystalline WO{sub 3} Thick films are fabricated by screen printing technique. • Monoclinic phases were the majority in formation of films. • The peak at 1643 cm{sup −1} shows stretching vibrations attributed to W-OH of adsorbed H{sub 2}O. • Absorption peaks in the range 879–650 cm{sup −1} are attributed to the stretching W-O-W bonds. • Increase in resistance with decrease in RH when exposed to 20–100% RH. - Abstract: Thick films of tungsten oxide based were prepared using standard screen printing technique. To study the effect of temperature on the thick films were fired at different temperature for 30 min in air atmosphere. The WO{sub 3} thick films were characterized with X-ray diffraction, scanning electron microscopy and EDAX for elemental analysis. The formation of mixed phases of the film together with majority of monoclinic phase was observed. IR spectra confirm the peak at 1643 cm{sup −1} clearly shows stretching vibrations attributed to the W-OH bending vibration mode of the adsorbed water molecules. The absorption peaks in the range 879–650 cm{sup −1} are attributed to the stretching W-O-W bonds (i.e. ν [W-O{sub inter}-W]). The peak located at 983 cm{sup −1} belong to W=O terminal of cluster boundaries. A change in the resistance was observed with respect to the relative humidity when the WO{sub 3} thick films were exposed to a wide humidity range of 20–100%. An increasing firing temperature of WO{sub 3} film increases with the sensitivity. The parameters such as sensitivity and hysteresis of the WO{sub 3} film sensors have been evaluated.

  15. Flexoelectricity induced increase of critical thickness in epitaxial ferroelectric thin films

    Energy Technology Data Exchange (ETDEWEB)

    Zhou Hao [State Key Laboratory for Turbulence and Complex Systems, College of Engineering, Peking University, Beijing 100871 (China); Hong Jiawang; Zhang Yihui [Department of Engineering Mechanics, Tsinghua University, Beijing 100084 (China); Li Faxin [State Key Laboratory for Turbulence and Complex Systems, College of Engineering, Peking University, Beijing 100871 (China); Pei Yongmao, E-mail: peiym@pku.edu.cn [State Key Laboratory for Turbulence and Complex Systems, College of Engineering, Peking University, Beijing 100871 (China); Fang Daining, E-mail: fangdn@pku.edu.cn [State Key Laboratory for Turbulence and Complex Systems, College of Engineering, Peking University, Beijing 100871 (China); Department of Engineering Mechanics, Tsinghua University, Beijing 100084 (China)

    2012-09-01

    Flexoelectricity describes the coupling between polarization and strain/stress gradients in insulating crystals. In this paper, using the Landau-Ginsburg-Devonshire phenomenological approach, we found that flexoelectricity could increase the theoretical critical thickness in epitaxial BaTiO{sub 3} thin films, below which the switchable spontaneous polarization vanishes. This increase is remarkable in tensile films while trivial in compressive films due to the electrostriction caused decrease of potential barrier, which can be easily destroyed by the flexoelectricity, between the ferroelectric state and the paraelectric state in tensile films. In addition, the films are still in a uni-polar state even below the critical thickness due to the flexoelectric effect.

  16. Interaction of water with faceted NiO(1 1 1) surface tuned by films thickness

    Science.gov (United States)

    Liu, Lixia; Wang, Shuai; Liu, Shuming; Guo, Qinlin; Guo, Jiandong

    2018-01-01

    The interaction of water with the polar surface of NiO(1 1 1) films has been investigated using various in situ surface analytical techniques, as well as ex situ scanning electron microscopy and atomic force microscopy. The {1 0 0} facets are formed on NiO(1 1 1) films upon annealing. The boundary between {1 0 0} facet and bare (1 1 1) face and the corner on the facet can facilitate dissociation of water. The total boundary length and the number of corner sites vary with film thickness. The dissociated hydroxyls are thermally stable up to 700 K on the thinner films. Consequently the activity of water dissociation can be tuned by adjusting the film thickness.

  17. Preparation and spectroscopic analysis of zinc oxide nanorod thin films of different thicknesses

    Directory of Open Access Journals (Sweden)

    Mia Nasrul Haque

    2017-10-01

    Full Text Available Zinc oxide thin films with different thicknesses were prepared on microscopic glass slides by sol-gel spin coating method, then hydrothermal process was applied to produce zinc oxide nanorod arrays. The nanorod thin films were characterized by various spectroscopic methods of analysis. From the images of field emission scanning electron microscope (FESEM, it was observed that for the film thickness up to 200 nm the formed nanorods with wurtzite hexagonal structure were uniformly distributed over the entire surface substrate. From X-ray diffraction analysis it was revealed that the thin films had good polycrystalline nature with highly preferred c-axis orientation along (0 0 2 plane. The optical characterization done by UV-Vis spectrometer showed that all the films had high transparency of 83 % to 96 % in the visible region and sharp cut off at ultraviolet region of electromagnetic spectrum. The band gap of the films decreased as their thickness increased. Energy dispersive X-ray spectroscopy (EDS showed the presence of zinc and oxygen elements in the films and Fourier transform infrared spectroscopy (FT-IR revealed the chemical composition of ZnO in the film.

  18. Impact of thickness on microscopic and macroscopic properties of Fe-Te-Se superconductor thin films

    Directory of Open Access Journals (Sweden)

    N. Zhang

    2015-04-01

    Full Text Available A series of iron based Fe-Te-Se superconductor thin films depositing on 0.7wt% Nb-doped SrTiO3 at substrate temperatures in the 250°C -450°C range by pulsed laser ablation of a constituents well defined precursor FeTe0.55Se0.55 target sample. We study the possible growth mechanism and its influence on the superconductor properties. Experimental results indicate the superconductive and non-superconductive properties are modulated only by the thickness of the thin films through the temperature range. The films appear as superconductor whenever the thickness is above a critical value ∼30nm and comes to be non-superconductor below this value. Relative ratios of Fe to (Te+Se in the films retained Fe/(Te+Se1 for non-superconductor no matter what the film growth temperature was. The effect of film growth temperature takes only the role of modulating the ratio of Te/Se and improving crystallinity of the systems. According to the experimental results we propose a sandglass film growth mechanism in which the interfacial effect evokes to form a Fe rich area at the interface and Se or Te starts off a consecutive filling up process of chalcogenide elements defect sides, the process is significant before the film thickness reaches at ∼30nm.

  19. Effects of thickness on electronic structure of titanium thin films

    Indian Academy of Sciences (India)

    using near-edge X-ray absorption fine structure (NEXAFS) technique at titanium L2,3 edge in total electron yield. (TEY) mode and transmission ... suring the total electron number per incident photon emi- tted from the material as a ..... hand, data points above this critical thickness at 4–10 nm in figure 4(b) reveals that BR is ...

  20. Pelvic floor muscle thickness measured by perineal ultrasonography

    DEFF Research Database (Denmark)

    Bernstein, Inge Thomsen; Juul, N; Grønvall, S

    1991-01-01

    Pelvic floor muscle thickness was assessed in nine healthy female physiotherapists by perineal sonography. All measurements were performed as triple-measurements. The aims were to assess the reliability of the measurements and to establish a reference material. The muscle thickness at rest...... and at contraction was 9.4 +/- 0.8 mm and 11.5 +/- 1.1 mm respectively (mean +/- SD). Contraction increased the thickness by 2.2 +/- 0.8 mm or 23 +/- 8%. The intra- and inter observer standard deviation of the estimate was in the range of 4-6%. In conclusion, we find the reliability of the measurements acceptable....

  1. Structural and magnetic properties of Co−Ti substituted barium hexaferrite thick films

    Energy Technology Data Exchange (ETDEWEB)

    Verma, Samiksha; Pandey, O.P. [School of Physics and Materials Science, Thapar University Patiala, 147004, Punjab (India); Paesano, Andrea [Departamento de Física, Universidade Estadual de Maringá, Av. Colombo, 5790, Maringá (Brazil); Sharma, Puneet, E-mail: puneet.sharma@thapar.edu [School of Physics and Materials Science, Thapar University Patiala, 147004, Punjab (India)

    2016-09-05

    Co−Ti substituted M-type barium hexaferrite BaFe{sub 12-2x}Co{sub x}Ti{sub x}O{sub 19} (0.0 ≤ x ≤ 1.0) thick films were prepared by screen printing method. X-ray diffraction analysis confirmed the formation of single phase BaFe{sub 12}O{sub 19} (BaM). The preferential site occupation of Co{sup 2+} and Ti{sup 4+} ion for Fe{sup 3+} ion at five different crystallographic sites (12k, 4f{sub 1}, 4f{sub 2}, 2a, and 2b) was measured by Mössbauer spectroscopy. The analyses showed Co−Ti ions preferentially occupy 2b and 4f{sub 2} sites which were responsible for drastic decrease in magnetocrystalline anisotropy field (H{sub a}). Magnetization (M) value found to be higher for x = 0.5. The coercivity (H{sub c}) dropped dramatically, recording a reduction of about 95% at x = 1.0, attributed to decreased in H{sub a}. SEM micrographs of Co−Ti substituted films revealed hexagonal grain structure. The magnetic properties of Co−Ti substituted BaM, suggests a possible candidate for microwave applications. - Highlights: • Single phase Co−Ti substituted BaM thick films are prepared from screen printing method. • The effect of Co−Ti substitution on structural and magnetic properties is studied. • Mössbauer spectroscopy illustrate, Co−Ti ions are preferentially occupy 2b and 4f{sub 2} sites. • Drastic decrease in magnetocrystalline anisotropy (H{sub a}) and (H{sub c}) is observed.

  2. Film Thickness Prediction in an Annular Two-Phase Flow around C-shaped Bend

    Directory of Open Access Journals (Sweden)

    P.M. Tkaczyk

    2011-03-01

    Full Text Available A finite volume method-based CFD model has been developed in the commercial code Star CD to simulate the annular gas-liquid flow through pipes and bends. The liquid film is solved explicitly by means of a modified Volume of Fluid (VOF method. The droplets are traced using a Lagrangian technique. The film to droplets (entrainment and droplets to film (stick, bounce, spread and splash interactions are taken into account using sub-models to complement the VOF model. A good agreement is found between the computed film thickness value and those cited in the literature.

  3. LPG and NH3 Sensing Properties of SnO2 Thick Film Resistors Prepared by Screen Printing Technique

    Directory of Open Access Journals (Sweden)

    A. S. GARDE

    2010-11-01

    Full Text Available The gas sensing behavior of SnO2 thick film resistors deposited on alumina substrates has been investigated for LPG and NH3 gas. The standard screen printing technology was used to prepare the thick films. The films were fired at optimized temperature of 780 0C for 30 minutes. The material characterization was performed by XRD, SEM, FTIR, UV and EDAX for elemental analysis. IR spectroscopy analysis at 2949.26 cm-1 showed the peak assigned to the –Sn-H vibration due to the effect of hybridization i.e. sp3 and the sharp peak at 3734.31 cm-1 assigned to –Sn-OH stretching vibration due to hydrogen bonding. The variation of D.C electrical resistance of SnO2 film samples was measured in air as well as in LPG and NH3 gas atmosphere as a function of temperature. The SnO2 film samples show negative temperature coefficient of résistance. The SnO2 film samples showed the highest sensitivity to 600 ppm of LPG at 230 0C and NH3 at 370 0C. The effect of microstructure on sensitivity, response time and recovery time of the sensor in the presence of LPG and NH3 gases were studied and discussed.

  4. Stratospheric thickness determined directly from satellite radiance measurements.

    Science.gov (United States)

    Quiroz, R. S.; Gelman, M. E.

    1972-01-01

    Discussion of the use of satellite radiance data for determining the thickness of deep stratospheric layers. Empirical regression equations are shown to provide better estimates of stratospheric thickness than do mean weighted temperatures obtained from the Planck equation. The best regression equations were found for thick layers emitting a substantial portion of the CO2-band infrared radiation measured by satellites. By adding the layer thickness to the observed height field for the lower boundary, it is possible to construct constant-pressure maps at very high altitudes.

  5. The effect of film thickness and molecular structure on order and disorder in thin films of compositionally asymmetric block copolymers

    Science.gov (United States)

    Mishra, Vindhya

    Directed self-assembly of thin film block copolymers offer a high throughput-low cost route to produce next generation lithographic devices, if one can bring the defect densities in the self assembled patterns below tolerance limits. However, the ability to control the nanoscale structure or morphology in thin film block copolymers presents challenges due to confinement effects on equilibrium behavior. Using structure characterization techniques such as grazing incidence small angle X-ray scattering (GISAXS), transmission electron and atomic force microscopy as well as self-consistent field theory, we have investigated how film thickness, annealing temperature and block copolymer structure affects the equilibrium behavior of asymmetric block copolymer films. Our studies have revealed the complicated dependence of order-disorder transitions, order-order transitions and symmetry transitions on film thickness. We found that the thickness dependent transition in the packing symmetry of spherical morphology diblock copolymers can be suppressed by blending with a small amount of majority block homopolymer, which allowed us to resolve the driving force behind this transition. Defect densities in, and the order-disorder transition temperature of, thin films of graphoepitaxially aligned diblock copolymer cylinders showed surprising sensitivity to the microdomain spacing. Methods to mitigate defect formation in thin films have been identified. The challenge of quantification of structural order in these systems was overcome using GISAXS, which allowed us to study the phenomena of disordering in two and three dimensions. Through studies on block copolymers which exhibit an order-order transition in bulk, we found that that subtle differences in the packing frustration of the spherical and cylindrical phases as well as the higher configurational entropy of free chain ends at the surface can drive the equilibrium configuration in thin films away from the stable bulk structure

  6. Modelling and optimization of film thickness variation for plasma enhanced chemical vapour deposition processes

    Science.gov (United States)

    Waddell, Ewan; Gibson, Des; Lin, Li; Fu, Xiuhua

    2011-09-01

    This paper describes a method for modelling film thickness variation across the deposition area within plasma enhanced chemical vapour deposition (PECVD) processes. The model enables identification and optimization of film thickness uniformity sensitivities to electrode configuration, temperature, deposition system design and gas flow distribution. PECVD deposition utilizes a co-planar 300mm diameter electrodes with separate RF power matching to each electrode. The system has capability to adjust electrode separation and electrode temperature as parameters to optimize uniformity. Vacuum is achieved using dry pumping with real time control of butterfly valve position for active pressure control. Comparison between theory and experiment is provided for PECVD of diamond-like-carbon (DLC) deposition onto flat and curved substrate geometries. The process utilizes butane reactive feedstock with an argon carrier gas. Radiofrequency plasma is used. Deposited film thickness sensitivities to electrode geometry, plasma power density, pressure and gas flow distribution are demonstrated. Use of modelling to optimise film thickness uniformity is demonstrated. Results show DLC uniformity of 0.30% over a 200 mm flat zone diameter within overall electrode diameter of 300mm. Thickness uniformity of 0.75% is demonstrated over a 200mm diameter for a non-conformal substrate geometry. Use of the modelling method for PECVD using metal-organic chemical vapour deposition (MOCVD) feedstock is demonstrated, specifically for deposition of silica films using metal-organic tetraethoxy-silane. Excellent agreement between experimental and theory is demonstrated for conformal and non-conformal geometries. The model is used to explore scalability of PECVD processes and trade-off against film thickness uniformity. Application to MEMS, optical coatings and thin film photovoltaics is discussed.

  7. Determining Confounding Sensitivities In Eddy Current Thin Film Measurements

    Energy Technology Data Exchange (ETDEWEB)

    Gros, Ethan; Udpa, Lalita; Smith, James A.; Wachs, Katelyn

    2016-07-01

    Determining Confounding Sensitivities In Eddy Current Thin Film Measurements Ethan Gros, Lalita Udpa, Electrical Engineering, Michigan State University, East Lansing MI 48824 James A. Smith, Experiment Analysis, Idaho National Laboratory, Idaho Falls ID 83415 Eddy current (EC) techniques are widely used in industry to measure the thickness of non-conductive films on a metal substrate. This is done using a system whereby a coil carrying a high-frequency alternating current is used to create an alternating magnetic field at the surface of the instrument's probe. When the probe is brought near a conductive surface, the alternating magnetic field will induce ECs in the conductor. The substrate characteristics and the distance of the probe from the substrate (the coating thickness) affect the magnitude of the ECs. The induced currents load the probe coil affecting the terminal impedance of the coil. The measured probe impedance is related to the lift off between coil and conductor as well as conductivity of the test sample. For a known conductivity sample, the probe impedance can be converted into an equivalent film thickness value. The EC measurement can be confounded by a number of measurement parameters. It is the goal of this research to determine which physical properties of the measurement set-up and sample can adversely affect the thickness measurement. The eddy current testing is performed using a commercially available, hand held eddy current probe (ETA3.3H spring loaded eddy probe running at 8 MHz) that comes with a stand to hold the probe. The stand holds the probe and adjusts the probe on the z-axis to help position the probe in the correct area as well as make precise measurements. The signal from the probe is sent to a hand held readout, where the results are recorded directly in terms of liftoff or film thickness. Understanding the effect of certain factors on the measurements of film thickness, will help to evaluate how accurate the ETA3.3H spring

  8. Simultaneous measurements of top surface and its underlying film surfaces in multilayer film structure.

    Science.gov (United States)

    Ghim, Young-Sik; Rhee, Hyug-Gyo; Davies, Angela

    2017-09-19

    With the growth of 3D packaging technology and the development of flexible, transparent electrodes, the use of multilayer thin-films is steadily increasing throughout high-tech industries including semiconductor, flat panel display, and solar photovoltaic industries. Also, this in turn leads to an increase in industrial demands for inspection of internal analysis. However, there still remain many technical limitations to overcome for measurement of the internal structure of the specimen without damage. In this paper, we propose an innovative optical inspection technique for simultaneous measurements of the surface and film thickness corresponding to each layer of multilayer film structures by computing the phase and reflectance over a wide range of wavelengths. For verification of our proposed method, the sample specimen of multilayer films was fabricated via photolithography process, and the surface profile and film thickness of each layer were measured by two different techniques of a stylus profilometer and an ellipsometer, respectively. Comparison results shows that our proposed technique enables simultaneous measurements of the top surface and its underlying film surfaces with high precision, which could not be measured by conventional non-destructive methods.

  9. Investigation of top electrode for PZT thick films based MEMS sensors

    DEFF Research Database (Denmark)

    Hindrichsen, Christian Carstensen; Pedersen, Thomas; Kristiansen, Paw T.

    2010-01-01

    In this work processing of screen printed piezoelectric PZT thick films on silicon substrates is investigated for use in future MEMS devices. E-beam evaporated Al and Pt are patterned on PZT as a top electrode using a lift-off process with a line width down to 3 mu m. Three test structures are used...... to investigate the optimal thickness of the top electrode, the degradation of the piezoelectric properties of the PZT film in absence of a diffusion barrier layer and finally how to fabricate electrical interconnects down the edge of the PZT thick film. The roughness of the PZT is found to have a strong...... influence on the conductance of the top electrode influencing the optimal top electrode thickness. A 100 nm thick top electrode on the PZT thick film with a surface roughness of 273 nm has a 4.5 times higher resistance compared to a similar wire on a planar SiO2 surface which has a surface roughness of less...

  10. Effect of thickness on the structural and optical properties of CuO thin films grown by successive ionic layer adsorption and reaction

    Energy Technology Data Exchange (ETDEWEB)

    Akaltun, Yunus, E-mail: yakaltun@erzincan.edu.tr

    2015-11-02

    CuO thin films were synthesised on glass substrates at room temperature using successive ionic layer adsorption and reaction (SILAR) method. The effect of film thickness on characteristic parameters such as the structural, morphological and optical properties of the films was investigated. The X-ray diffraction (XRD) and scanning electron microscopy (SEM) studies showed that all of the films exhibited polycrystalline structure with monoclinic phases and covered the glass substrates well. The crystalline and morphology of the films improved with increasing film thickness. The optical band gap decreased from 2.03 to 1.79 eV depending on the film thickness. The refractive index (n), electron effective mass (m{sub e}{sup ⁎}/m{sub o}) and static and frequency dielectric constants (ε{sub o}, ε{sub ∞}) were determined using the energy band gap values. - Highlights: • CuO thin films were deposited using SILAR method. • The electron effective mass, refractive index, dielectric constant values were calculated. • Characterisation of the films has been performed using XRD, SEM, Raman and optical measurements. • The d values of the planes of with thickness show no variation.

  11. Formulation and Characterization of Cu Doped ZnO Thick Films as LPG Gas Sensor

    Directory of Open Access Journals (Sweden)

    A. V. PATIL

    2010-12-01

    Full Text Available Thick films of pure and various concentrations (1 wt. %, 3 wt. %, 5 wt. %, 7 wt. % and 10 wt. % of Cu-doped ZnO were prepared on alumina substrates using a screen printing technique. These films were fired at a temperature of 700ºC for two hours in an air atmosphere. Morphological, compositional and structural properties of the samples were obtained using the scanning electron microscopy (SEM, Energy dispersive spectroscopy (EDAX and X-ray diffraction techniques respectively. The LPG gas sensing properties of these thick films were investigated at different operating temperatures and LPG gas concentrations. The surface resistance of thick films decreases when exposed to LPG gas. The Cu doped films show significant sensitivity to LPG gas than pure ZnO film. 5 wt. % Cu-doped ZnO film was found to be more sensitive (87.3 % to LPG gas exposed at 300 oC than other doping concentrations with fast response and recovery time.

  12. Statistical Analyses of AY-101 Ultrasonic Measurements of Wall Thickness

    International Nuclear Information System (INIS)

    Weier, Dennis R.

    2002-01-01

    Tank AY-101 wall thicknesses have been measured using ultrasonic (UT) images. Interest is in using the available data to estimate a worst-case minimum wall thickness for regions of the tank that remain unexamined with the UT approach. Each UT image can provide the wall thickness at a very large number of pixels, but only the minimum value for each image is used in this work. Since the data arise in this manner, one of several candidate statistical extreme value distributions should successfully fit these reported minimum values. Given a set of multiple UT images and the resulting minimum measured wall thicknesses, extreme value distributions are fit to the data with subsequent extrapolations made to estimate the minimum measured wall thickness expected for the entire tank. Such a minimum estimate incorporates both the variability in wall thicknesses and the uncertainty associated with the measurement method. Uncertainties of the estimated parameters are also derived and used in propagation of variance methods to obtain confidence bounds on the estimated minimum measured wall thickness as well

  13. Interaction domains in high performance NdFeB thick films

    Energy Technology Data Exchange (ETDEWEB)

    Woodcock, Tom; Khlopkov, Kirill; Schultz, Ludwig; Gutfleisch, Oliver [IFW Dresden, IMW, Dresden (Germany); Walther, Arno [Insitut Neel, CNRS-UJF, Grenoble (France); CEA Leti - MINATEC, Grenoble (France); Dempsey, Nora; Givord, Dominique [Insitut Neel, CNRS-UJF, Grenoble (France)

    2009-07-01

    Thick sputtered films (5-300 micron) of NdFeB have excellent hard magnetic properties which make them attractive for applications in micro-electro-mechanical systems (MEMS). A two step process consisting of triode sputtering and high temperature annealing produced films with energy densities approaching those of sintered NdFeB magnets. Magnetic force microscopy (MFM) using hard magnetic tips showed that the films deposited without substrate heating and at 300 C exhibited magnetic domains typical of low anisotropy materials. These films were amorphous in the as-deposited state. The film deposited at 500 C was crystalline and displaid hard magnetic properties. This was reflected in the magnetic microstructure which showed interaction domains typical of highly textured and high magnetic anisotropy materials with a grain size below or equal to the critical single-domain particle limit. With increasing substrate temperature, the domain patterns of the annealed films became coarser, indicating higher degrees of texture.

  14. Bio-interfaces--interaction of PLL/HA thick films with nanoparticles and microcapsules.

    Science.gov (United States)

    Skirtach, Andre G; Volodkin, Dmitry V; Möhwald, Helmuth

    2010-03-15

    The interaction of biocompatible, exponentially grown films composed of poly-L-lysine (PLL) and hyaluronic acid (HA) polymers with gold nanoparticles and microcapsules is studied. Both aggregated and non-aggregated nanoparticle states are achieved; desorption of PLL accounts for aggregation of nanoparticles. The presence of aggregates of gold nanoparticles on films enables remote activation by near-infrared irradiation due to local, nanometer confined heating. Thermally shrunk microcapsules, which are remarkably monodisperse upon preparation but gain polydispersity after months of storage, are also adsorbed onto films. PLL polymers desorbed from films interact with microcapsules introducing a charge imbalance which leads to an increase of the microcapsule size, thus films amplify this effect. Multifunctional, biocompatible, thick gel films with remote activation and release capabilities are targeted for cell cultures in biology and tissue engineering in medicine.

  15. Polycrystalline Ba0.6Sr0.4TiO3 thin films on r-plane sapphire: Effect of film thickness on strain and dielectric properties

    Science.gov (United States)

    Fardin, E. A.; Holland, A. S.; Ghorbani, K.; Akdogan, E. K.; Simon, W. K.; Safari, A.; Wang, J. Y.

    2006-10-01

    Polycrystalline Ba0.6Sr0.4TiO3 (BST) films grown on r-plane sapphire exhibit strong variation of in-plane strain over the thickness range of 25-400nm. At a critical thickness of ˜200nm, the films are strain relieved; in thinner films, the strain is tensile, while compressive strain was observed in the 400nm film. Microwave properties of the films were measured from 1to20GHz by the interdigital capacitor method. A capacitance tunability of 64% was observed in the 200nm film, while thinner films showed improved Q factor. These results demonstrate the possibility of incorporating frequency agile BST-based devices into the silicon on sapphire process.

  16. Homogeneity Analysis of a MEMS-based PZT Thick Film Vibration Energy Harvester Manufacturing Process

    DEFF Research Database (Denmark)

    Lei, Anders; Xu, Ruichao; Borregaard, Louise M.

    2012-01-01

    This paper presents a homogeneity analysis of a high yield wafer scale fabrication of MEMS-based unimorph silicon/PZT thick film vibration energy harvesters aimed towards vibration sources with peak vibrations in the range of around 300Hz. A wafer with a yield of 91% (41/45 devices) has been...... indicating that the main variation in open circuit voltage performance is caused by varying quality factor. The average resonant frequency was measured to 333Hz with a standard variation of 9.8Hz and a harvesting bandwidth of 5-10Hz. A maximum power output of 39.3μW was achieved at 1g for the best performing...... harvester....

  17. Formation and physical properties of YBCO thick films grown by using the electrophoretic deposition method

    CERN Document Server

    Kim, U J; Kim, Y C; Han, S K; Kang, K Y

    1999-01-01

    Thick films of the YBa sub 2 Cu sub 3 O subgamma sub - subdelta (YBCO) superconductor were prepared by using the electrophoretic deposition technique and a flexible wire as the substrate. The transition temperature of the wires was 91 K, the intragranular magnetic critical current density J sub c sub g sup m sup a sup g was about 10 sup 5 A/cm sup 2 at 77 K in a weak field, and the transport J sub c sup t sup r sup a sup n sup s was about 365 A/cm sup 2 at 77 K. We calculated the intergranular magnetic critical current J sub c sub J sup m sup a sup g and the activation energy from the AC-susceptibility measurements, and their values were about 444 A/cm sup 2 at 77 K and 2.02 eV, respectively.

  18. Effects of rework on adhesion of Pb-In soldered gold thick films

    International Nuclear Information System (INIS)

    Gehman, R.W.; Becka, G.A.; Losure, J.A.

    1982-02-01

    The feasibility of repeatedly reworking Pb-In soldered joints on gold thick films was evaluated. Nailhead adhesion tests on soldered thick films typically resulted in failure within the bulk solder (50 In-50 Pb). Average strengths increased with each rework, and the failure mode changed. An increase in metalization lift-off occurred with successive reworks. An investigation was initiated to determine why these changes occurred. Based on this work, the thick film adhesion to the substrate appeared to be lowered by indium reduction of cadmium oxide and by formation of a weak, brittle intermetallic compound, Au 9 In 4 . It was concluded that two solder reworks could be conducted without significant amounts of metallization lift-off during nailhead testing

  19. X-ray fluorescence application (WDXRFS) for determining thin films thickness

    International Nuclear Information System (INIS)

    Scapin, Valdirene O.; Scapin, Marcos A.; Salvador, Vera L.R.; Lima, Nelson B. de; Mitani, Solange E.; Samad, Ricardo E.

    2002-01-01

    Establishment of a method for the quantitative determination of the thickness of a thin films nickel simple on glass substrate, using the technique of Wavelength Dispersion X-ray Fluorescence Spectrometry (WD-XRFS) and the method of fundamental parameters. The advantages of using this technique are: precision, high sensitivity, non destructive analysis. A RIGAKU X-ray fluorescence spectrometry was used, model RIX 3000, 1996 of the X-ray Fluorescence Laboratory, Chemistry and Environment Center of the Instituto de Pesquisas Energeticas e Nucleares - IPEN - CNEN/SP. Films were obtained through the process of Physical Vapor Deposition in the Thin Films Laboratory, Laser and Applications Center of the Instituto de Pesquisas Energeticas e Nucleares - IPEN - CNEN/SP. Samples were analyzed with thickness between 10-100 nm and the results were satisfactory when compared with the technique Physical Vapor Deposition and theoretical values by mathematical expression for the calculation of thicknesses. (author)

  20. Reaction products between Bi-Sr-Ca-Cu-oxide thick films and alumina substrates

    International Nuclear Information System (INIS)

    Alarco, J.A.; Ilushechkin, A.; Yamashita, T.; Bhargava, A.; Barry, J.; Mackinnon, I.D.R.

    1997-01-01

    The structure and composition of reaction products between Bi-Sr-Ca-Cu-oxide (BSCCO) thick films and alumina substrates have been characterized using a combination of electron diffraction, scanning electron microscopy and energy dispersive X-ray spectrometry (EDX). Sr and Ca are found to be the most reactive cations with alumina. Sr 4 Al 6 O 12 SO 4 is formed between the alumina substrates and BSCCO thick films prepared from paste with composition close to Bi-2212 (and Bi-2212+10 wt.% Ag). For paste with composition close to Bi(Pb)-2223 +20 wt.% Ag, a new phase with f.c.c. structure, lattice parameter about a=24.5 A and approximate composition Al 3 Sr 2 CaBi 2 CuO x has been identified in the interface region. Understanding and control of these reactions is essential for growth of high quality BSCCO thick films on alumina. (orig.)

  1. Low-temperature CO gas sensors based on Au/SnO{sub 2} thick film

    Energy Technology Data Exchange (ETDEWEB)

    Wang Shurong [Department of Chemistry, Nankai University, Tianjin 300071 (China); Zhao Yingqiang [Department of Chemistry, Nankai University, Tianjin 300071 (China); Huang Jing [Department of Chemistry, Nankai University, Tianjin 300071 (China); Wang Yan [Department of Chemistry, Nankai University, Tianjin 300071 (China); Ren Hongxia [Department of Chemistry, Nankai University, Tianjin 300071 (China); Wu Shihua [Department of Chemistry, Nankai University, Tianjin 300071 (China)]. E-mail: shrwang@nankai.edu.cn; Zhang Shoumin [Department of Chemistry, Nankai University, Tianjin 300071 (China); Huang Weiping [Department of Chemistry, Nankai University, Tianjin 300071 (China)

    2007-01-15

    A study on the low-temperature CO gas sensors based on Au/SnO{sub 2} thick film was reported. Au/SnO{sub 2} powders were prepared by a deposition-precipitation method. Thick films were fabricated from Au/SnO{sub 2} powders. X-ray diffraction (XRD), high-resolution transmission electron microscopy (HRTEM) and X-ray photoelectron spectroscopy (XPS) analyses were carried out for investigation of morphology and crystalline structure. Au/SnO{sub 2} thick film sensors exhibited high sensitivity to CO gas at relatively low operating temperature (83-210 deg. C). We also reported the effect of the calcination temperature of Au/SnO{sub 2} on the CO gas sensing behavior. The optimal calcination temperature of Au/SnO{sub 2} was 300 deg. C.

  2. Accuracy of ultrasound-measured bladder wall thickness for the ...

    African Journals Online (AJOL)

    M.M. Ali

    measured urinary bladder wall thickness. (BWT) in the diagnosis of detrusor overactivity (DO). Subjects and methods: Patients who had undergone urodynamic testing due to irritative lower urinary tract symptoms (LUTS) were evaluated for ...

  3. Electrical properties and conduction mechanisms of Ru-based thick-film (cermet) resistors

    International Nuclear Information System (INIS)

    Pike, G.E.; Seager, C.H.

    1977-01-01

    This paper presents an experimental study of the electrical conduction mechanisms in thick-film (cermet) resistor. The resistors were made from one custom and three commercially formulated inks with sheet resistivities ranging from 10 2 to 10 6 Ω/D 7 Alembertian in decade increments. Their microstructure and composition have been examined using optical and scanning electron microscopy, electron microprobe analysis, x-ray diffraction, and various chemical analyses. This portion of our study shows that the resistors are heterogeneous mixtures of metallic metal oxide particles (approx.4 x 10 -5 cm in diameter) and a lead silicate glass. The metal oxide particles are ruthenium containing pyrochlores, and are joined to form a continuous three-dimensional network of chain segments. The principal experimental work reported here is an extensive study of the electrical transport properties of the resistors. The temperature dependence of conductance has been measured from 1.2 to 400 K, and two features common to all resistors are found. There is a pronounced decrease in conductance at low temperatures and a shallow maximum at several hundred Kelvin. Within the same range of temperatures the reversible conductance as a function of electric field from 0 to 28 kV/cm has been studied. The resistors are non-Ohmic at all temperatures, but particularly at cryogenic temperatures for low fields. At higher fields the conductance shows a linear variation with electric field. The thick-film resistors are found to have a small dielectric constant and a (nearly) frequency-independent conductance from dc to 50 MHz. The magnetoresistance to 100 kG, the Hall mobility, and the Seebeck coefficient of most of the resistors have been measured and discovered to be quite small. Many of the electrical transport properties have also been determined for the metal oxide particles which were extracted from the fired resistors

  4. Hydrogen in hydrogenated amorphous silicon thick film and its relation to the photoresponse of the film in contact with molybdenum

    International Nuclear Information System (INIS)

    Sridhar, N.; Chung, D.D.L.

    1992-01-01

    This paper reports that hydrogenated amorphous silicon films of thickness 0.5-7 μm on molybdenum substrates were deposited from silane by dc glow discharge and studied by mass spectrometric observation of the evolution of hydrogen upon heating and correlating this information with the photoresponse. The films were found to contain two types of hydrogen, namely weak bonded hydrogen, which evolved at 365 degrees C and was the minority, and strongly bonded hydrogen, which evolved at 460-670 degrees C and was the majority. The proportion of strongly bonded hydrogen increased with increasing film thickness and with increasing substrate temperature during deposition. The total amount of hydrogen increased when the substrate temperature was decreased from 350 to 275 degrees C. The strongly bonded hydrogen resided throughout the thickness of the film, whereas the weakly bonded hydrogen resided near the film surface. The evolution of the strongly bonded hydrogen was diffusion controlled, with an activation energy of 1.6 eV. The strongly bonded hydrogen enhanced the photoresponse, whereas the weakly bonded hydrogen degraded the photoresponse

  5. Electrophoretic deposition of highly textured YBa2Cu3O7-x thick films

    International Nuclear Information System (INIS)

    Heim, M.; Mahner, E.; Muller, G.; Piel, H.; Ponto, L.; Becks, M.; Klein, U.; Peiniger, M.

    1989-01-01

    The authors have developed an electrophoretic technique for the deposition of polycrystalline YBa 2 Cu 3 O 7 - x layers of several tens of microns in thickness on arbitrary shaped silver substrates. Applying a magnetic field H of 8 T to the suspension a high degree of c-axis texturing parallel to H and perpendicular to the surface has been achieved for such layers as shown by x-ray diffraction. After sintering for about 140 h at 920 degrees C in pure oxygen the textured thick films provide much better superconducting properties than the untextured ones and than bulk samples. Magnetic shielding measurements yield narrower transition curves and higher T c values due to improved intergrain contacts. The surface resistance R s has been measured on coated silver discs of 24 mm diameter in a copper host cavity at 22 GHz between 4.2 K and 300 K. For the best sample, R s (100 K) is 0.33 Ω which corresponds to a resistivity of 130 μ Ω cm. Below T c app 92 ± 1K, R s drops at first steeply and then gradually to 18 mΩ at 77K and less than 3 mΩ at 4.2 K. Since these values are lower than R s of pure copper, microwave applications of high T c superconductors like cavities with high quality factors are within reach now

  6. Application of X-ray fluorescence (WDXRF): thickness and chemical composition determination of thin films

    International Nuclear Information System (INIS)

    Scapin, Valdirene de Oliveira.

    2004-01-01

    In this work a procedure is described for thickness and quantitative chemical composition of thin films by wavelength dispersion X-ray fluorescence (WDXRF) using Fundamental Parameters method. This method was validated according to quality assurance standard and applied sample Al, Cr, TiO2, Ni, ZrO2 (single thickness) and Ni/Cr (double thickness) on glass; Ni on steel and metallic zinc and TiO2 on metallic iron (single thickness), all the sample were prepared for physical deposition of vapor (PVD). The thickness had been compared with Absorption (FRX-A) and Rutherford Backscattering Spectrometry (RBS) methods; the result showed good efficiency of the fundamental parameters method. Sample structural characteristics analyzed by X ray diffraction (XRD) showed any influence in the thickness determinations. (author)

  7. Impact of polymer film thickness and cavity size on polymer flow during embossing : towards process design rules for nanoimprint lithography.

    Energy Technology Data Exchange (ETDEWEB)

    Schunk, Peter Randall; King, William P. (Georgia Institute of Technology, Atlanta, GA); Sun, Amy Cha-Tien; Rowland, Harry D. (Georgia Institute of Technology, Atlanta, GA)

    2006-08-01

    This paper presents continuum simulations of polymer flow during nanoimprint lithography (NIL). The simulations capture the underlying physics of polymer flow from the nanometer to millimeter length scale and examine geometry and thermophysical process quantities affecting cavity filling. Variations in embossing tool geometry and polymer film thickness during viscous flow distinguish different flow driving mechanisms. Three parameters can predict polymer deformation mode: cavity width to polymer thickness ratio, polymer supply ratio, and Capillary number. The ratio of cavity width to initial polymer film thickness determines vertically or laterally dominant deformation. The ratio of indenter width to residual film thickness measures polymer supply beneath the indenter which determines Stokes or squeeze flow. The local geometry ratios can predict a fill time based on laminar flow between plates, Stokes flow, or squeeze flow. Characteristic NIL capillary number based on geometry-dependent fill time distinguishes between capillary or viscous driven flows. The three parameters predict filling modes observed in published studies of NIL deformation over nanometer to millimeter length scales. The work seeks to establish process design rules for NIL and to provide tools for the rational design of NIL master templates, resist polymers, and process parameters.

  8. Interaction domains in high-performance NdFeB thick films

    Energy Technology Data Exchange (ETDEWEB)

    Woodcock, T.G. [IFW Dresden, Institute for Metallic Materials, P.O. Box 270116, D-01171 Dresden (Germany)], E-mail: t.woodcock@ifw-dresden.de; Khlopkov, K. [IFW Dresden, Institute for Metallic Materials, P.O. Box 270116, D-01171 Dresden (Germany); Walther, A. [Insitut Neel, CNRS-UJF, 25 avenue de Martyrs, 38042 Grenoble (France); CEA Leti - MINATEC, 17 rue des Martyrs, 38054 Grenoble (France); Dempsey, N.M.; Givord, D. [Insitut Neel, CNRS-UJF, 25 avenue de Martyrs, 38042 Grenoble (France); Schultz, L.; Gutfleisch, O. [IFW Dresden, Institute for Metallic Materials, P.O. Box 270116, D-01171 Dresden (Germany)

    2009-05-15

    The magnetic domain structure in sputtered NdFeB thick films has been imaged by magnetic force microscopy. The local texture of the films was investigated by electron backscatter diffraction. The average misorientation of the grains was shown to decrease with increasing substrate temperature during deposition. Interaction domains were observed and are discussed with reference (i) to the sample grain size compared to the single domain particle size and (ii) to sample texture.

  9. Effect of diffusion on percolation threshold in thick-film resistors

    International Nuclear Information System (INIS)

    Abdurakhmanov, G.

    2009-01-01

    Resistivity ρ(C) of thick-film resistors doped by metal oxides is simulated as a function of volume content C of the ligature, firing temperature T f and firing time τ. It is proved that the doping of a glass during firing of the thick film resistor is rather uniform. It is shown also, that conductance takes place in the whole volume of the sample, but not through the sole infinite cluster only, even the content of a conductive phase is below than the theoretical percolation threshold value.

  10. Effects of thickness on the statistical properties of the Barkhausen noise in amorphous films

    International Nuclear Information System (INIS)

    Santi, L.; Bohn, F.; Viegas, A.D.C.; Durin, G.; Magni, A.; Bonin, R.; Zapperi, S.; Sommer, R.L.

    2006-01-01

    The statistical properties of the Barkhausen noise (BN) in thin amorphous films are studied as a function of both the nominal composition and the thickness. BN was observed in single films with nominal compositions Fe 73.5 Cu 1 Nb 3 Si 22.5-x B x (with x=4 and 9) in the thickness range 20nm-5μm. The distributions of Barkhausen jump sizes and duration times were obtained and fitted to power laws with critical exponents τ=1.25+/-0.05 and α=1.60+/-0.05, respectively

  11. Determination of gold coating thickness measurement by using EDXRF

    International Nuclear Information System (INIS)

    Meor Yusoff Meor Sulaian; Masliana Muslimin; Fadlullah Jili Fursani

    2005-01-01

    The paper relates a study on the development of an analysis procedure for measuring the gold coating thickness using EDXRF technique. Gold coating thickness was measured by relating the counts under the Au L? peak its thickness value. In order to get a reasonably accurate result, a calibration graph was plotted using five gold-coated reference standards of different thickness. The calibration graph shows a straight line for thin coating measurement until 0.9 μm. Beyond this the relationship was not linear and this may be resulted from the self-absorption effect. Quantitative analysis was also performed on two different samples of gold coated jewelry and a phone connector. Result from the phone connector analysis seems to agree with the manufacturer gold coating value. From the analysis of gold-coated jewelry it had been able to differentiate the two articles as gold wash and gold electroplated. (Author)

  12. Thickness dependence of electro-optical properties of WO{sub 3} films as an electrochromic functional material for energy-efficient applications

    Energy Technology Data Exchange (ETDEWEB)

    Esmail, Ayat; Hashem, Hany; Soltan, Soltan; Hammam, Mahmoud; Ramadan, Ahmed [Faculty of Science, Department of Physics, Helwan University, Cairo (Egypt)

    2017-01-15

    WO{sub 3} films of different thicknesses (100, 200, and 300 nm) were prepared by two vacuum physical vapor deposition (PVD) methods (thermal evaporation and an electron gun). Electrophysical measurements (cyclic voltammetry and chronoamperometry) were carried out using a potentiostat in an electrochromic cell (liquid device) that consists of a substrate coated with double layers of F: SnO{sub 2} and WO{sub 3} served as working electrodes. X-ray diffraction showed an amorphous structure for all the deposited WO{sub 3} thin films. While the transmission in the bleached state does not change and it is close to the as-deposited state, it is slightly less at larger thickness. The cyclic voltammogram was more open (more current flow) for thicker films due to the less dense structure with many channels. Also, the coloration efficiency was higher at low thickness. The response time was of the order of seconds and decreased for coloration, while it increased for the bleaching process as the film thickness increases. According to the proposed figure of merit, the electrochromic performance deteriorates as the WO{sub 3} film thickness decreases. However, the thickness is more effective in the case of an electron gun. Generally, continuous films but thinner than 200 nm, are recommended for deposition methods. (copyright 2016 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim)

  13. Model-based cartilage thickness measurement in the submillimeter range

    International Nuclear Information System (INIS)

    Streekstra, G. J.; Strackee, S. D.; Maas, M.; Wee, R. ter; Venema, H. W.

    2007-01-01

    Current methods of image-based thickness measurement in thin sheet structures utilize second derivative zero crossings to locate the layer boundaries. It is generally acknowledged that the nonzero width of the point spread function (PSF) limits the accuracy of this measurement procedure. We propose a model-based method that strongly reduces PSF-induced bias by incorporating the PSF into the thickness estimation method. We estimated the bias in thickness measurements in simulated thin sheet images as obtained from second derivative zero crossings. To gain insight into the range of sheet thickness where our method is expected to yield improved results, sheet thickness was varied between 0.15 and 1.2 mm with an assumed PSF as present in the high-resolution modes of current computed tomography (CT) scanners [full width at half maximum (FWHM) 0.5-0.8 mm]. Our model-based method was evaluated in practice by measuring layer thickness from CT images of a phantom mimicking two parallel cartilage layers in an arthrography procedure. CT arthrography images of cadaver wrists were also evaluated, and thickness estimates were compared to those obtained from high-resolution anatomical sections that served as a reference. The thickness estimates from the simulated images reveal that the method based on second derivative zero crossings shows considerable bias for layers in the submillimeter range. This bias is negligible for sheet thickness larger than 1 mm, where the size of the sheet is more than twice the FWHM of the PSF but can be as large as 0.2 mm for a 0.5 mm sheet. The results of the phantom experiments show that the bias is effectively reduced by our method. The deviations from the true thickness, due to random fluctuations induced by quantum noise in the CT images, are of the order of 3% for a standard wrist imaging protocol. In the wrist the submillimeter thickness estimates from the CT arthrography images correspond within 10% to those estimated from the anatomical

  14. Experimental studies of O2-SnO2 surface interaction using powder, thick films and monocrystalline thin films

    International Nuclear Information System (INIS)

    Saukko, S.; Lassi, Ulla; Lantto, V.; Kroneld, M.; Novikov, S.; Kuivalainen, P.; Rantala, T.T.; Mizsei, J.

    2005-01-01

    Surface properties of solids and the interactions between molecules and solid surfaces are important for many technical applications. They also involve a range of physical and chemical phenomena of fundamental scientific interest. The importance of oxygen chemistry at SnO 2 surfaces follows from the fact that SnO 2 is used as an active material in gas sensor applications. The operation principle of these sensors is usually based on measurable conductance response of the material, which is understood in terms of reactions of gas molecules with different oxygen species adsorbed onto the surface. The role of the lattice oxygen, but in particular, the bridging oxygen atoms on SnO 2 surfaces, is also active. Detailed understanding of the reaction mechanisms of various oxygen species at SnO 2 surfaces is important, as it offers a way to improve the sensitivity and selectivity of the sensors. Oxygen adsorption-desorption kinetics at the SnO 2 surface is studied experimentally using O 2 -temperature-programmed desorption (TPD) method together with conductance measurements in the case of SnO 2 powder and polycrystalline thick films made from the powder. In addition, CO-TPD is studied and the transient behaviour of various oxygen species is considered. Molecular beam epitaxy (MBE) was also used to fabricate polycrystalline and monocrystalline thin films with the SnO 2 (101) face on single crystal sapphire substrate. Simultaneous surface potential and conductance measurements during heating and cooling in different ambient atmospheres were used to characterize the monocrystalline SnO 2 (101) surface after various surface treatments

  15. Pore-scale analysis of the minimum liquid film thickness around elongated bubbles in confined gas-liquid flows

    Science.gov (United States)

    Magnini, M.; Beisel, A. M.; Ferrari, A.; Thome, J. R.

    2017-11-01

    The fluid mechanics of elongated bubbles in confined gas-liquid flows in micro-geometries is important in pore-scale flow processes for enhanced oil recovery and mobilization of colloids in unsaturated soil. The efficiency of such processes is traditionally related to the thickness of the liquid film trapped between the elongated bubble and the pore's wall, which is assumed constant. However, the surface of long bubbles presents undulations in the vicinity of the rear meniscus, which may significantly decrease the local thickness of the liquid film, thus impacting the process of interest. This study presents a systematic analysis of these undulations and the minimum film thickness induced in the range Ca = 0.001- 0.5 and Re = 0.1- 2000 . Pore-scale Computational Fluid Dynamics (CFD) simulations are performed with a self-improved version of the opensource solver ESI OpenFOAM which is based on a Volume of Fluid method to track the gas-liquid interface. A lubrication model based on the extension of the classical axisymmetric Bretherton theory is utilized to better understand the CFD results. The profiles of the rear meniscus of the bubble obtained with the lubrication model agree fairly well with those extracted from the CFD simulations. This study shows that the Weber number of the flow, We = Ca Re , is the parameter that best describes the dynamics of the interfacial waves. When We 0.1, a larger number of wave crests becomes evident on the surface of the rear meniscus of the bubble. The liquid film thickness at the crests of the undulations thins considerably as the Reynolds number is increased, down to less than 60% of the value measured in the flat film region. This may significantly influence important environmental processes, such as the detachment and mobilization of micron-sized pollutants and pathogenic micro-organisms adhering at the pore's wall in unsaturated soil.

  16. Nanoporous nickel oxide thin films and its improved electrochromic performance: Effect of thickness

    Science.gov (United States)

    Dalavi, D. S.; Suryavanshi, M. J.; Patil, D. S.; Mali, S. S.; Moholkar, A. V.; Kalagi, S. S.; Vanalkar, S. A.; Kang, S. R.; Kim, J. H.; Patil, P. S.

    2011-01-01

    Electrochromic properties of chemically bath deposited nanoporous NiO thin films were investigated as a function of film thickness using Ni sulphate precursor, aqueous ammonia and potassium persulphate as complexing and oxidizing agents respectively. The films were characterized for their structural, morphological, optical and electrochromic properties using X-ray diffraction, scanning electron microscopy, FT-IR spectroscopy, cyclic voltammetry, chronoamperometry and optical transmittance studies. X-ray diffraction patterns show that the films are polycrystalline, consisting of NiO cubic phase. Infrared spectroscopy results show the presence of free hydroxyl ion and water in NiO thin films. SEM micrographs revealed nanoporous nature composed of interconnected nanoporous network, forming well defined 3D nano envelopes. The optical band gap energy was found to be decreased from 3.22 to 2.80 eV with increasing film thickness. The electrochromic properties of all the films were investigated in aqueous (KOH) and non aqueous (LiClO4-PC) electrolyte by means of cyclic voltammetry (CV), chronocoulometry (CC) and optical studies. The transmittance modulations or optical density differences during the coloring/bleaching process were found to be increased with the film thickness. This increment in optical differences led to an increase in coloration efficiency (CE) to about 95 cm2/C, which is two times more than that observed in KOH and response time of 2.9 s for bleaching (reduction) and 3.5 s for coloration (oxidation) observed for the film deposited at 60 min with excellent electrochemical stability up to 3000 c/b cycles in LiClO4-PC electrolyte.

  17. Nanoporous nickel oxide thin films and its improved electrochromic performance: Effect of thickness

    Energy Technology Data Exchange (ETDEWEB)

    Dalavi, D.S.; Suryavanshi, M.J.; Patil, D.S.; Mali, S.S. [Thin Films Materials Laboratory, Department of Physics, Shivaji University, Kolhapur-416004, Maharashtra (India); Moholkar, A.V. [Department of Materials Science and Engineering, Chonnam National University (Korea, Republic of); Kalagi, S.S.; Vanalkar, S.A. [Thin Films Materials Laboratory, Department of Physics, Shivaji University, Kolhapur-416004, Maharashtra (India); Kang, S.R.; Kim, J.H. [Department of Materials Science and Engineering, Chonnam National University (Korea, Republic of); Patil, P.S., E-mail: patilps_2000@yahoo.com [Thin Films Materials Laboratory, Department of Physics, Shivaji University, Kolhapur-416004, Maharashtra (India)

    2011-01-15

    Electrochromic properties of chemically bath deposited nanoporous NiO thin films were investigated as a function of film thickness using Ni sulphate precursor, aqueous ammonia and potassium persulphate as complexing and oxidizing agents respectively. The films were characterized for their structural, morphological, optical and electrochromic properties using X-ray diffraction, scanning electron microscopy, FT-IR spectroscopy, cyclic voltammetry, chronoamperometry and optical transmittance studies. X-ray diffraction patterns show that the films are polycrystalline, consisting of NiO cubic phase. Infrared spectroscopy results show the presence of free hydroxyl ion and water in NiO thin films. SEM micrographs revealed nanoporous nature composed of interconnected nanoporous network, forming well defined 3D nano envelopes. The optical band gap energy was found to be decreased from 3.22 to 2.80 eV with increasing film thickness. The electrochromic properties of all the films were investigated in aqueous (KOH) and non aqueous (LiClO{sub 4}-PC) electrolyte by means of cyclic voltammetry (CV), chronocoulometry (CC) and optical studies. The transmittance modulations or optical density differences during the coloring/bleaching process were found to be increased with the film thickness. This increment in optical differences led to an increase in coloration efficiency (CE) to about 95 cm{sup 2}/C, which is two times more than that observed in KOH and response time of 2.9 s for bleaching (reduction) and 3.5 s for coloration (oxidation) observed for the film deposited at 60 min with excellent electrochemical stability up to 3000 c/b cycles in LiClO{sub 4}-PC electrolyte.

  18. An evaluation of dental radiograph accuracy in the measurement of enamel thickness.

    Science.gov (United States)

    Grine, F E; Stevens, N J; Jungers, W L

    2001-12-01

    Many studies have employed lateral radiographs to measure the thickness of tooth enamel in recent human and fossil hominid samples, but the accuracy of measurements obtained by this technique has not been assessed. In this study, 20 isolated human maxillary permanent molars were radiographed using the parallel film technique. The crowns were then sectioned longitudinally through the tips of the buccal cusps. Measurements of enamel cap area, and of linear enamel thickness in the occlusal basin and over the metacone apex, were made from the radiographs and corresponding sectioned surfaces. Comparisons of the two sets of values revealed that radiographs generally overestimated enamel thickness but there was considerable variability in the error by which measurements from radiographs either under- or overestimated the true value. Lateral radiographs may provide a rough visual impression of whether a tooth has thin or thick enamel but they do not generally provide for accurate measurement of enamel thickness. Quantitative data on enamel thickness from studies that have employed lateral radiographs should be viewed with circumspection.

  19. Comparison of Different Approaches for Measuring Tibial Cartilage Thickness

    Directory of Open Access Journals (Sweden)

    Maier Jennifer

    2017-07-01

    Full Text Available Osteoarthritis is a degenerative disease affecting bones and cartilage especially in the human knee. In this context, cartilage thickness is an indicator for knee cartilage health. Thickness measurements are performed on medical images acquired in-vivo. Currently, there is no standard method agreed upon that defines a distance measure in articular cartilage. In this work, we present a comparison of different methods commonly used in literature. These methods are based on nearest neighbors, surface normal vectors, local thickness and potential field lines. All approaches were applied to manual segmentations of tibia and lateral and medial tibial cartilage performed by experienced raters. The underlying data were contrast agent-enhanced cone-beam C-arm CT reconstructions of one healthy subject’s knee. The subject was scanned three times, once in supine position and two times in a standing weight-bearing position. A comparison of the resulting thickness maps shows similar distributions and high correlation coefficients between the approaches above 0.90. The nearest neighbor method results on average in the lowest cartilage thickness values, while the local thickness approach assigns the highest values. We showed that the different methods agree in their thickness distribution. The results will be used for a future evaluation of cartilage change under weight-bearing conditions.

  20. Determination of thickness and optical constants of solgel derived polyvinylpyrrolidone/ZrO2 films from transmission spectra using different dispersion models.

    Science.gov (United States)

    Jia, Hongbao; Sun, Jinghua; Xu, Yao; Wu, Dong

    2012-10-10

    Transmission measurements have been used to investigate the optical properties of polyvinylpyrrolidone (PVP)/ZrO(2) films synthesized by the solgel route. The optical constants of PVP/ZrO(2) films deposited on quartz substrates were determined by fitting transmission spectra in the wavelength range of 200-800 nm with the Tauc-Lorentz and Cody-Lorentz physical models. Combined with Urbach tail, both models give a good description of transmission data and reveal that refractive index of film slightly decreases with increasing PVP mass fraction. X-ray reflectivity (XRR) measurements were also performed on PVP/ZrO(2) films to complement the thicknesses. The value of film thickness, including interface information from transmission spectra, is consistent with that result obtained from XRR, indicating that fitting transmission spectrum is a high reliable optical characterization.

  1. Effect of film thickness and filler properties on sulphuric acid permeation in various commercially available epoxy mortar coatings.

    Science.gov (United States)

    Valix, M; Mineyama, H; Chen, C; Cheung, W H; Shi, J; Bustamante, H

    2011-01-01

    The performance of various commercially available epoxy mortar coatings was compared by measuring their sulphuric acid diffusivity. Apparent diffusivities, which were measured gravimetrically, were found to be dependent on coating tortuosity. In composite materials like epoxy mortars, the tortuosity was determined by filler properties and polymer alignment. Tortuosity was found to depend on the filler size, their dispersion, filler aspect ratio and concentration. The order and greater alignment of polymer aggregates, which characterises thinner coatings effects higher tortuosity and thus lower permeabilities. The result is that sulphuric acid diffusivities were observed to increase with coating thickness, which challenges the notion that greater coating thicknesses provide greater protection or environmental barrier. The effect of film thickness and filler properties observed in this study has significant implications to the current selection of coatings and sewer protection.

  2. Performances of screen-printing silver thick films: Rheology, morphology, mechanical and electronic properties

    Energy Technology Data Exchange (ETDEWEB)

    Jiang, Jung-Shiun; Liang, Jau-En; Yi, Han-Liou [Department of Chemical Engineering, National Chung Cheng University, Chia Yi 621, Taiwan, ROC (China); Chen, Shu-Hua [China Steel Corporation, Kaohsiung City 806, Taiwan, ROC (China); Hua, Chi-Chung, E-mail: chmcch@ccu.edu.tw [Department of Chemical Engineering, National Chung Cheng University, Chia Yi 621, Taiwan, ROC (China)

    2016-06-15

    Numerous recent applications with inorganic solar cells and energy storage electrodes make use of silver pastes through processes like screen-printing to fabricate fine conductive lines for electron conducting purpose. To date, however, there have been few studies that systematically revealed the properties of the silver paste in relation to the mechanical and electronic performances of screen-printing thick films. In this work, the rheological properties of a series of model silver pastes made of silver powders of varying size (0.9, 1.3, and 1.5 μm) and shape (irregular and spherical) were explored, and the results were systematically correlated with the morphological feature (scanning electron microscopy, SEM) and mechanical (peeling test) and electronic (transmission line method, TLM) performances of screen-printing dried or sintered thick films. We provided evidence of generally intimate correlations between the powder dispersion state in silver pastes—which is shown to be well captured by the rheological protocols employed herein—and the performances of screen-printing thick films. Overall, this study suggests the powder dispersion state and the associated phase behavior of a paste sample can significantly impact not only the morphological and electronic but also mechanical performances of screen-printing thick films, and, in future perspectives, a proper combination of silver powders of different sizes and even shapes could help reconcile quality and stability of an optimum silver paste. - Highlights: • Powder dispersion correlates well with screen-printing thick film performances. • Rheological fingerprints can be utilized to fathom the powder dispersion state. • Good polymer-powder interactions in the paste ensure good powder dispersion. • Time-dependent gel-like viscoelastic features are found with optimum silver pastes. • The size and shape of functional powder affect the dispersion and film performances.

  3. Thickness Dependence of Switching Behavior in Ferroelectric BiFeO3 Thin Films: A Phase-Field Simulation

    Directory of Open Access Journals (Sweden)

    Guoping Cao

    2017-11-01

    Full Text Available A phase-field approach to the analysis of the thickness effects in electric-field-induced domain switching in BiFeO3 thin films has been formulated. Time evolutions of domain switching percentage for films with different thicknesses were explored to reveal the primary switching path and its dependence on film thickness. In addition, hysteresis loop for these films were calculated to obtain their coercive fields. Results show a nonlinear thickness dependence of coercive field for ultrathin films. A parametric study of the interactions between film thickness, coercive field, current-voltage (I-V response, and polarization switching behavior is herein discussed, which could provide physical insights into materials engineering.

  4. Structural, dielectric and magnetic properties of BaFe12-xAlxO19 hexaferrite thick films

    Science.gov (United States)

    Mahadevan, Santhoshkumar; Pahwa, Chhavi; Narang, Sukhleen Bindra; Sharma, Puneet

    2017-11-01

    BaFe12-xAlxO19 (0 ≤ x 0 ≤ 2.5) powders and thick films were prepared by solid state synthesis method and screen printing technique respectively. X-ray diffraction confirmed the single phase without any impurity phase. Bond length calculation from FTIR spectra suggested the occupation of Al3+ ions at octahedral and tetrahedral sites. Magnetic measurements showed that coercivity (Hc), saturation magnetization (Ms) and anisotropic field (Ha) strongly depends on the substitution amount. As compared to the powder, substituted thick films possess higher Hc despite its larger grain size. M-T measurement showed a decrease in Curie temperature from ∼497 °C (x = 0.0) to ∼437 °C (x = 2.0). High dielectric constant (εr) and low losses (tan δ) were observed in Al3+ substituted samples. However, εr decrease and tan δ increase with temperature. Scanning electron micrographs showed that Al3+ substitution promotes hexagonal shaped grains in sintered thick films. Complex permeability behavior in X-band frequency is also investigated and found to be less in Al-substituted samples. Reflection losses are increased with Al3+ substitution and found maximum (-47 dB at 9.3 GHz) for x = 1.5.

  5. Measurement of subcutaneous adipose tissue thickness by near-infrared

    International Nuclear Information System (INIS)

    Wang, Yu; Ying, Zeqiang; Hao, Dongmei; Zhang, Song; Yang, Yimin; Zeng, Yanjun

    2013-01-01

    Obesity is strongly associated with the risks of diabetes and cardiovascular disease, and there is a need to measure the subcutaneous adipose tissue (SAT) layer thickness and to understand the distribution of body fat. A device was designed to illuminate the body parts by near-infrared (NIR), measure the backscattered light, and predict the SAT layer thickness. The device was controlled by a single-chip microcontroller (SCM), and the thickness value was presented on a liquid crystal display (LCD). There were 30 subjects in this study, and the measurements were performed on 14 body parts for each subject. The paper investigated the impacts of pressure and skin colour on the measurement. Combining with principal component analysis (PCA) and support vector regression (SVR), the measurement accuracy of SAT layer thickness was 89.1 % with a mechanical caliper as reference. The measuring range was 5–11 mm. The study provides a non-invasive and low-cost technique to detect subcutaneous fat thickness, which is more accessible and affordable compared to other conventional techniques. The designed device can be used at home and in community.

  6. The thickness measuring methods by means of radionuclides

    International Nuclear Information System (INIS)

    Henker, W.

    1974-01-01

    The thickness measuring devices RMM 24004 produced in German Democratic Republic are described. They consist of measuring probe and central unit. The measuring probe contains radiator and measuring head, which consists of radiation detector and electrometric amplifier. They utilize absorption or backscattering of 147 Pm, 85 Kr, 90 Sr/ 90 Y, 106 Ru/ 106 Rh or 137 Cs radiation in interaction with atoms of measured material. A survey of typical applications is given. (Z.M.)

  7. Thickness determination of large-area films of yttria-stabilized zirconia produced by pulsed laser deposition

    DEFF Research Database (Denmark)

    Pryds, N.; Christensen, Bo Toftmann; Bilde-Sørensen, Jørgen

    2006-01-01

    Films of yuria-stabilized zirconia (YSZ) on a polished silicon substrate of diameter up to 125 mm have been produced in a large-area pulsed laser deposition (PLD) setup under typical PLD conditions. The film thickness over the full film area has been determined by energy-dispersive Xray spectrome......Films of yuria-stabilized zirconia (YSZ) on a polished silicon substrate of diameter up to 125 mm have been produced in a large-area pulsed laser deposition (PLD) setup under typical PLD conditions. The film thickness over the full film area has been determined by energy-dispersive Xray...

  8. The influence of thickness on memory characteristic based on nonvolatile tuning behavior in poly(N-vinylcarbazole) films

    International Nuclear Information System (INIS)

    Sun, Yanmei; Ai, Chunpeng; Lu, Junguo; Li, Lei; Wen, Dianzhong; Bai, Xuduo

    2016-01-01

    The memory characteristic based on nonvolatile tuning behavior in indium tin oxide/poly(N-vinylcarbazole)/aluminum (ITO/PVK/Al) was investigated, the different memory behaviors were first observed in PVK film as the film thickness changing. By control of PVK film thickness with different spinning speeds, the nonvolatile behavior of ITO/PVK/Al sandwich structure can be tuned in a controlled manner. Obviously different nonvolatile behaviors, such as (i) flash memory behavior and (ii) write-once-read-many times (WORM) memory behavior are from the current–voltage (I–V) characteristics of the PVK films. The results suggest that the film thickness plays a key part in determining the memory type of the PVK. - Highlights: • The different memory behaviors were observed in PVK film. • The nonvolatile behavior of ITO/PVK/Al sandwich structure can be tuned. • The film thickness plays a key part in determining the memory type of the PVK.

  9. Thick film titania on glass supports for vapour phase photocatalytic degradation of toluene, acetone, and ethanol

    Czech Academy of Sciences Publication Activity Database

    Neti, R.N.; Parmar, G.R.; Bakardjieva, Snejana; Šubrt, Jan

    2010-01-01

    Roč. 163, č. 3 (2010), s. 219-229 ISSN 1385-8947 Institutional research plan: CEZ:AV0Z40320502 Keywords : titania photocatalyst * thick films * glass support Subject RIV: CA - Inorganic Chemistry Impact factor: 3.074, year: 2010

  10. Ethanol gas sensing properties of Al2 O3 -doped ZnO thick film ...

    Indian Academy of Sciences (India)

    WINTEC

    -doped ZnO thick film resistors. D R PATIL, L A PATIL* and D P AMALNERKAR. †. Materials Research Lab, Pratap College, Amalner 425 401, India. †. Centre for Materials for Electronics Technology, Pune 411 008, India. MS received 13 July 2007. Abstract. The characterization and ethanol gas sensing properties of ...

  11. Microstructural Studies of Ni-P Thick Film Resistor Temperature Sensors

    Directory of Open Access Journals (Sweden)

    Barbara Holodnik

    1986-01-01

    Full Text Available Thick Ni-P films have been widely investigated at our Institute. This article tends to visualize by use of various microscopic methods how the growth and sintering of individual conducting grains, results in the formation of nickel dendrites responsible for the metallic character of electrical conduction.

  12. Thick-Film and LTCC Passive Components for High-Temperature Electronics

    Directory of Open Access Journals (Sweden)

    A. Dziedzic

    2013-04-01

    Full Text Available At this very moment an increasing interest in the field of high-temperature electronics is observed. This is a result of development in the area of wide-band semiconductors’ engineering but this also generates needs for passives with appropriate characteristics. This paper presents fabrication as well as electrical and stability properties of passive components (resistors, capacitors, inductors made in thick-film or Low-Temperature Co-fired Ceramics (LTCC technologies fulfilling demands of high-temperature electronics. Passives with standard dimensions usually are prepared by screen-printing whereas combination of standard screen-printing with photolithography or laser shaping are recommenced for fabrication of micropassives. Attainment of proper characteristics versus temperature as well as satisfactory long-term high-temperature stability of micropassives is more difficult than for structures with typical dimensions for thick-film and LTCC technologies because of increase of interfacial processes’ importance. However it is shown that proper selection of thick-film inks together with proper deposition method permit to prepare thick-film micropassives (microresistors, air-cored microinductors and interdigital microcapacitors suitable for the temperature range between 150°C and 400°C.

  13. Equivalent-circuit model for the thickness-shear mode resonator with a viscoelastic film near film resonance.

    Science.gov (United States)

    Martin, S J; Bandey, H L; Cernosek, R W; Hillman, A R; Brown, M J

    2000-01-01

    We derive a lumped-element, equivalent-circuit model for the thickness-shear mode (TSM) resonator with a viscoelastic film. This modified Butterworth-Van Dyke model includes in the motional branch a series LCR resonator, representing the quartz resonance, and a parallel LCR resonator, representing the film resonance. This model is valid in the vicinity of film resonance, which occurs when the acoustic phase shift across the film is an odd multiple of pi/2 rad. For low-loss films, this model accurately predicts the frequency changes and damping that arise at resonance and is a reasonable approximation away from resonance. Elements of the parallel LCR resonator are explicitly related to film properties and can be interpreted in terms of elastic energy storage and viscous power dissipation. The model leads to a simple graphical interpretation of the coupling between the quartz and film resonances and facilitates understanding of the resulting responses. These responses are compared with predictions from the transmission-line and Sauerbrey models.

  14. Thickness measurement instrument with memory storage of multiple calibrations

    International Nuclear Information System (INIS)

    Lieber, S.; Schlesinger, J.; Lieber, D.; Baker, A.

    1979-01-01

    An improved backscatter instrument for the nondestructive measurement of coatings on a substrate is described. A memory having selectable memory areas, each area having stored intelligence available which is determinative of the shape of a functional plot of coating thickness versus backscatter counts per minute unique for each particular combination of emitting isotope, substrate material, coating material and physical characteristics of the measuring instrument. A memory selector switch connects a selected area of memory to a microprocessor operating under program control whereby the microprocessor reads the intelligence stored at the selected area and converts the backscattered count of the coating being measured into indicia of coating thickness

  15. Measurements of acoustic properties for thin films

    International Nuclear Information System (INIS)

    Kushibiki, J.; Maehara, H.; Chubachi, N.

    1982-01-01

    A measurement method for determining thin-film acoustic properties, such as characteristic acoustic impedance, sound velocity, density, and stiffness constant, is developed with a simple measurement principle and high measurement accuracy. The acoustic properties are determined from a maximum reflection loss and a center frequency obtained through a frequency response of the reflection loss for an acoustic transmission line composed of a sapphire/film/water system by using the acoustic pulse mode measurement system in the UHF range. The determination of the acoustic properties is demonstrated for sputtered fused quartz film, low-expansion borosilicate glass films, and chalcogenide glass films of evaporated As 2 S 3 and As 2 Se 3 , within the measurement accuracy around 1--2%. It is also found that the acoustic properties of thin films are generally different from those of bulk materials, depending on the fabrication techniques and conditions

  16. Method for rapid, controllable growth and thickness, of epitaxial silicon films

    Science.gov (United States)

    Wang, Qi [Littleton, CO; Stradins, Paul [Golden, CO; Teplin, Charles [Boulder, CO; Branz, Howard M [Boulder, CO

    2009-10-13

    A method of producing epitaxial silicon films on a c-Si wafer substrate using hot wire chemical vapor deposition by controlling the rate of silicon deposition in a temperature range that spans the transition from a monohydride to a hydrogen free silicon surface in a vacuum, to obtain phase-pure epitaxial silicon film of increased thickness is disclosed. The method includes placing a c-Si substrate in a HWCVD reactor chamber. The method also includes supplying a gas containing silicon at a sufficient rate into the reaction chamber to interact with the substrate to deposit a layer containing silicon thereon at a predefined growth rate to obtain phase-pure epitaxial silicon film of increased thickness.

  17. Experimental Comparison of the Behavior between Base Oil and Grease Starvation Based on Inlet Film Thickness

    Directory of Open Access Journals (Sweden)

    D. Kostal

    2017-03-01

    Full Text Available This paper deals with the experimental study of an elastohydrodynamic contact under conditions of insufficient lubricant supply. Starvation level of this type of the contact may be experimentally determined based on the position of the meniscus, but this way can't determine all levels of starvation. Consequent development in the field of tribology achieved theoretical model that can determine all levels of starvation by dependency on the thickness of the lubricant film entering the contact, but it is difficult for experimental verification. The main goal of this work is an experimental study and description of the behavior of the elastohydrodynamic contact with controlled thickness of the lubricant film at the contact input. Contact was lubricated by the base oil and the grease and compared. Results were surprising because the only differences between oil and grease were observed for more viscous lubricants at thicker film layer entering to the contact.

  18. Model-based cartilage thickness measurement in the submillimeter range

    NARCIS (Netherlands)

    Streekstra, G. J.; Strackee, S. D.; Maas, M.; ter Wee, R.; Venema, H. W.

    2007-01-01

    Current methods of image-based thickness measurement in thin sheet structures utilize second derivative zero crossings to locate the layer boundaries. It is generally acknowledged that the nonzero width of the point spread function (PSF) limits the accuracy of this measurement procedure. We propose

  19. Thickness dependence of polydopamine thin films on detection sensitivity of surface plasmon-enhanced fluorescence biosensors

    Science.gov (United States)

    Toma, Mana; Tawa, Keiko

    2018-03-01

    A bioinspired polydopamine (PDA) coating is a good candidate for the rapid and cheap chemical modification of biosensor surfaces. Herein, we report the effect of PDA thickness on the detection sensitivity of a fluorescence biosensor utilizing surface plasmon-enhanced fluorescence. The thickness of PDA films was tuned by the incubation time of the dopamine solution and varied from 1 to 17 nm. The detection sensitivity was evaluated as the limit of detection (LOD) of a fluorescently labelled target analyte by a model immunoassay. The LOD was determined to be 1.6 pM for the thickest PDA film and was improved to 1.0 pM by reducing the thickness to the range from 1 to 5 nm, corresponding to the incubation time of 10 to 60 min. The experimental results indicate that the PDA coating is suitable for the surface functionalization of biosensors in mass production as it does not require precise control of the incubation time.

  20. Measurement of compressed breast thickness by optical stereoscopic photogrammetry.

    Science.gov (United States)

    Tyson, Albert H; Mawdsley, Gordon E; Yaffe, Martin J

    2009-02-01

    The determination of volumetric breast density (VBD) from mammograms requires accurate knowledge of the thickness of the compressed breast. In attempting to accurately determine VBD from images obtained on conventional mammography systems, the authors found that the thickness reported by a number of mammography systems in the field varied by as much as 15 mm when compressing the same breast or phantom. In order to evaluate the behavior of mammographic compression systems and to be able to predict the thickness at different locations in the breast on patients, they have developed a method for measuring the local thickness of the breast at all points of contact with the compression paddle using optical stereoscopic photogrammetry. On both flat (solid) and compressible phantoms, the measurements were accurate to better than 1 mm with a precision of 0.2 mm. In a pilot study, this method was used to measure thickness on 108 volunteers who were undergoing mammography examination. This measurement tool will allow us to characterize paddle surface deformations, deflections and calibration offsets for mammographic units.

  1. Growth, surface treatment and characterization of polycrystalline lead iodide thick films prepared using close space deposition technique

    International Nuclear Information System (INIS)

    Zhu, Xinghua; Sun, Hui; Yang, Dingyu; Zheng, Xiaolin

    2012-01-01

    Lead iodide (PbI 2 ) polycrystalline thick films were fabricated on glass substrates with a conductive indium–tin-oxide layer using a close space deposition technique. The morphology of the as-deposited PbI 2 films is typically and highly oriented polycrystalline structure, made up of microcrystal platelets upright on the substrate plane. Two techniques including the surface mechanical cutting and after-growth cadmium telluride coating were employed to improve the films′ surface properties. It was shown that both of the film surface treatment methods markedly decreased the dark current of PbI 2 films. The photo-to-dark current ratio of about 2.05 under 241 Am γ-ray source with activity of 2.78 μCi irradiation was obtained from the film treated using both surface cutting and after-growth CdTe coating. Charge transport characteristics of these films were measured and the hole mobility 7.7×10 −2 –1.67×10 −1 cm 2 /V s was estimated.

  2. Thickness of Residual Wetting Film in Liquid-Liquid Displacement in Capillary Channels

    Science.gov (United States)

    Beresnev, I. A.; Gaul, W.; Vigil, D.

    2010-12-01

    Core-annular flow is common in nature, representing, for example, how streams of oil, surrounded by water, move in petroleum reservoirs. Oil, typically a non-wetting fluid, tends to occupy the middle (core) part of a channel, while water forms a surrounding wall-wetting film. What is the thickness of this wetting film? Understanding this question may determine the ultimate oil recovery. A classic theory has been in existence for nearly 50 years offering a solution, although in a controversial manner, for moving gas bubbles. On the other hand, an acceptable, experimentally verified theory for a body of one liquid flowing in another has not been available. We develop a hydrodynamic, testable theory providing an explicit relationship between the thickness of the wetting film and fluid properties for a blob of one fluid moving in another, with neither phase being gas. In its relationship to the capillary number Ca, the thickness of the film is predicted to be proportional to Ca2 at lower Ca and to level off at a constant value of about 20 % the channel radius at higher Ca. The thickness of the film is deduced to be approximately unaffected by the viscosity ratio of the fluids. We have conducted our own laboratory experiments and compiled experimental data from other studies, all of which are mutually consistent and confirm the salient features of the theory. At the same time, the classic law, originally deduced for films surrounding moving gas bubbles but often believed to hold for liquids as well, fails to explain the observations.

  3. Thermoelectric Mixed Thick-/Thin Film Microgenerators Based on Constantan/Silver

    Directory of Open Access Journals (Sweden)

    Mirosław Gierczak

    2018-01-01

    Full Text Available This paper describes the design, manufacturing and characterization of newly developed mixed thick-/thin film thermoelectric microgenerators based on magnetron sputtered constantan (copper-nickel alloy and screen-printed silver layers. The thermoelectric microgenerator consists of sixteen thermocouples made on a 34.2 × 27.5 × 0.25 mm3 alumina substrate. One of thermocouple arms was made of magnetron-sputtered constantan (Cu-Ni alloy, the second was a Ag-based screen-printed film. The length of each thermocouple arm was equal to 27 mm, and their width 0.3 mm. The distance between the arms was equal to 0.3 mm. In the first step, a pattern mask with thermocouples was designed and fabricated. Then, a constantan layer was magnetron sputtered over the whole substrate, and a photolithography process was used to prepare the first thermocouple arms. The second arms were screen-printed onto the substrate using a low-temperature silver paste (Heraeus C8829A or ElectroScience Laboratories ESL 599-E. To avoid oxidation of constantan, they were fired in a belt furnace in a nitrogen atmosphere at 550/450 °C peak firing temperature. Thermoelectric and electrical measurements were performed using the self-made measuring system. Two pyrometers included into the system were used for temperature measurement of hot and cold junctions. The estimated Seebeck coefficient, α was from the range 35 − 41 µV/K, whereas the total internal resistances R were between 250 and 3200 ohms, depending on magnetron sputtering time and kind of silver ink (the resistance of a single thermocouple was between 15.5 and 200 ohms.

  4. Control of thickness uniformity and grain size in graphene films for transparent conductive electrodes

    International Nuclear Information System (INIS)

    Wu Wei; Yu Qingkai; Pei, Shin-Shem; Peng Peng; Bao Jiming; Liu Zhihong

    2012-01-01

    Large-scale and transferable graphene films grown on metal substrates by chemical vapor deposition (CVD) still hold great promise for future nanotechnology. To realize the promise, one of the key issues is to further improve the quality of graphene, e.g., uniform thickness, large grain size, and low defects. Here we grow graphene films on Cu foils by CVD at ambient pressure, and study the graphene nucleation and growth processes under different concentrations of carbon precursor. On the basis of the results, we develop a two-step ambient pressure CVD process to synthesize continuous single-layer graphene films with large grain size (up to hundreds of square micrometers). Scanning electron microscopy and Raman spectroscopy characterizations confirm the film thickness and uniformity. The transferred graphene films on cover glass slips show high electrical conductivity and high optical transmittance that make them suitable as transparent conductive electrodes. The growth mechanism of CVD graphene on Cu is also discussed, and a growth model has been proposed. Our results provide important guidance toward the synthesis of high quality uniform graphene films, and could offer a great driving force for graphene based applications. (paper)

  5. Magnetic and magnetoresistance studies of nanometric electrodeposited Co films and Co/Cu layered structures: Influence of magnetic layer thickness

    International Nuclear Information System (INIS)

    Zsurzsa, S.; Péter, L.; Kiss, L.F.; Bakonyi, I.

    2017-01-01

    The magnetic properties and the magnetoresistance behavior were investigated for electrodeposited nanoscale Co films, Co/Cu/Co sandwiches and Co/Cu multilayers with individual Co layer thicknesses ranging from 1 nm to 20 nm. The measured saturation magnetization values confirmed that the nominal and actual layer thicknesses are in fairly good agreement. All three types of layered structure exhibited anisotropic magnetoresistance for thick magnetic layers whereas the Co/Cu/Co sandwiches and Co/Cu multilayers with thinner magnetic layers exhibited giant magnetoresistance (GMR), the GMR magnitude being the largest for the thinnest Co layers. The decreasing values of the relative remanence and the coercive field when reducing the Co layer thickness down to below about 3 nm indicated the presence of superparamagnetic (SPM) regions in the magnetic layers which could be more firmly evidenced for these samples by a decomposition of the magnetoresistance vs. field curves into a ferromagnetic and an SPM contribution. For thicker magnetic layers, the dependence of the coercivity (H c ) on magnetic layer thickness (d) could be described for each of the layered structure types by the usual equation H c =H co +a/d n with an exponent around n=1. The common value of n suggests a similar mechanism for the magnetization reversal by domain wall motion in all three structure types and hints also at the absence of coupling between magnetic layers in the Co/Cu/Co sandwiches and Co/Cu multilayers. - Highlights: • Electrodeposited nanoscale Co films and Co/Cu layered structures. • Co layer thickness (d) dependence of coercivity (H c ) and magnetoresistance. • H c depends on Co layer thickness according to H c =H co +a/d n with n around 1. • The common n value suggests a similar mechanism of magnetization reversal. • The common n value suggests the absence of coupling between magnetic layers.

  6. Magnetic and magnetoresistance studies of nanometric electrodeposited Co films and Co/Cu layered structures: Influence of magnetic layer thickness

    Energy Technology Data Exchange (ETDEWEB)

    Zsurzsa, S., E-mail: zsurzsa.sandor@wigner.mta.hu; Péter, L.; Kiss, L.F.; Bakonyi, I.

    2017-01-01

    The magnetic properties and the magnetoresistance behavior were investigated for electrodeposited nanoscale Co films, Co/Cu/Co sandwiches and Co/Cu multilayers with individual Co layer thicknesses ranging from 1 nm to 20 nm. The measured saturation magnetization values confirmed that the nominal and actual layer thicknesses are in fairly good agreement. All three types of layered structure exhibited anisotropic magnetoresistance for thick magnetic layers whereas the Co/Cu/Co sandwiches and Co/Cu multilayers with thinner magnetic layers exhibited giant magnetoresistance (GMR), the GMR magnitude being the largest for the thinnest Co layers. The decreasing values of the relative remanence and the coercive field when reducing the Co layer thickness down to below about 3 nm indicated the presence of superparamagnetic (SPM) regions in the magnetic layers which could be more firmly evidenced for these samples by a decomposition of the magnetoresistance vs. field curves into a ferromagnetic and an SPM contribution. For thicker magnetic layers, the dependence of the coercivity (H{sub c}) on magnetic layer thickness (d) could be described for each of the layered structure types by the usual equation H{sub c}=H{sub co}+a/d{sup n} with an exponent around n=1. The common value of n suggests a similar mechanism for the magnetization reversal by domain wall motion in all three structure types and hints also at the absence of coupling between magnetic layers in the Co/Cu/Co sandwiches and Co/Cu multilayers. - Highlights: • Electrodeposited nanoscale Co films and Co/Cu layered structures. • Co layer thickness (d) dependence of coercivity (H{sub c}) and magnetoresistance. • H{sub c} depends on Co layer thickness according to H{sub c}=H{sub co}+a/d{sup n} with n around 1. • The common n value suggests a similar mechanism of magnetization reversal. • The common n value suggests the absence of coupling between magnetic layers.

  7. Secondary electron emission yield on poled silica based thick films

    DEFF Research Database (Denmark)

    Braga, D.; Poumellec, B.; Cannas, V.

    2004-01-01

    injection, we pointed out an electric field 0.5 µm below the surface for our poling conditions and directed in the same direction as the external field applied during the poling process. Then, the dependence of on the injected dose of electrons allows us to deduce that the poling process disturbs the glass......Studies on the distribution of the electric field produced by a thermal poling process in a layer of Ge-doped silica on silicon substrate, by using secondary electron emission yield (SEEY) measurements () are presented. Comparing 0 between poled and unpoled areas, the SEEY at the origin of electron...... structure strongly enough for leading to a weak conductivity. It is then easy to display the poled areas. We have also pointed out an effect of the electric properties of the glass on the measurements obtained with the Electron Probe for MicroAnalysis....

  8. Measuring and overcoming limits of the Saffman-Delbrück model for soap film viscosities.

    Science.gov (United States)

    Vivek, Skanda; Weeks, Eric R

    2015-01-01

    We observe tracer particles diffusing in soap films to measure the two-dimensional (2D) viscous properties of the films. Saffman-Delbrück type models relate the single-particle diffusivity to parameters of the film (such as thickness h) for thin films, but the relation breaks down for thicker films. Notably, the diffusivity is faster than expected for thicker films, with the crossover at h/d = 5.2 ± 0.9 using the tracer particle diameter d. This indicates a crossover from purely 2D diffusion to diffusion that is more three-dimensional. We demonstrate that measuring the correlations of particle pairs as a function of their separation overcomes the limitations of the Saffman-Delbrück model and allows one to measure the viscosity of a soap film for any thickness.

  9. Magnetic hysteresis measurements of thin films under isotropic stress.

    Science.gov (United States)

    Holland, Patrick; Dubey, Archana; Geerts, Wilhelmus

    2000-10-01

    Nowadays, ferromagnetic thin films are widely applied in devices for information technology (credit cards, video recorder tapes, floppies, hard disks) and sensors (air bags, anti-breaking systems, navigation systems). Thus, with the increase in the use of magnetic media continued investigation of magnetic properties of materials is necessary to help in determining the useful properties of materials for new or improved applications. We are currently interested in studying the effect of applied external stress on Kerr hysteresis curves of thin magnetic films. The Ni and NiFe films were grown using DC magnetron sputtering with Ar as the sputter gas (pAr=4 mTorr; Tsub=55-190 C). Seed and cap layers of Ti were used on all films for adhesion and oxidation protection, respectively. A brass membrane pressure cell was designed to apply in-plane isotropic stress to thin films. In this pressure cell, gas pressure is used to deform a flexible substrate onto which a thin magnetic film has been sputtered. The curvature of the samples could be controlled by changing the gas pressure to the cell. Magneto-Optical in-plane hysteresis curves at different values of strain were measured. The results obtained show that the stress sensitivity is dependent on the film thickness. For the 500nm NiFe films, the coercivity strongly decreased as a function of the applied stress.

  10. Thickness dependencies of structural and magnetic properties of cubic and tetragonal Heusler alloy bilayer films

    Science.gov (United States)

    Ranjbar, R.; Suzuki, K. Z.; Sugihara, A.; Ando, Y.; Miyazaki, T.; Mizukami, S.

    2017-07-01

    The thickness dependencies of the structural and magnetic properties for bilayers of cubic Co-based Heusler alloys (CCHAs: Co2FeAl (CFA), Co2FeSi (CFS), Co2MnAl (CMA), and Co2MnSi (CMS)) and D022-MnGa were investigated. Epitaxy of the B2 structure of CCHAs on a MnGa film was achieved; the smallest thickness with the B2 structure was found for 3-nm-thick CMS and CFS. The interfacial exchange coupling (Jex) was antiferromagnetic (AFM) for all of the CCHAs/MnGa bilayers except for unannealed CFA/MnGa samples. A critical thickness (tcrit) at which perpendicular magnetization appears of approximately 4-10 nm for the CMA/MnGa and CMS/MnGa bilayers was observed, whereas this thickness was 1-3 nm for the CFA/MnGa and CFS/MnGa films. The critical thickness for different CCHAs materials is discussed in terms of saturation magnetization (Ms) and the Jex .

  11. Structural Characterization of Perpendicularly Aligned Submicrometer-Thick Synthetic Glycolipid Polycrystalline Films Using Conventional X-ray Diffraction

    Directory of Open Access Journals (Sweden)

    Shigesaburo Ogawa

    2017-12-01

    Full Text Available The structural analysis of the synthetic glycolipid crystalline phase has been performed during the past few decades; however, it has not been sufficiently understood in terms of both static and dynamic aspects. We have recently shown that grazing incidence X-ray diffraction (GIXD affords better information than conventional powder X-ray diffraction (PXRD for the crystal structure analysis of octyl β-d-galactoside (MOβGal using sub-micrometer-thick crystalline films and a two-dimensional detector, together with a synchrotron radiation source. However, access to this technique is not universal because of the limited machine time at the required synchrotron radiation sources. Herein, we employed XRD analysis on MOβGal hemihydrate crystalline films using commercial X-ray sources instead of synchrotron radiation sources to extend the availability of the methodology. We investigated some technical aspects of the methodology, such as incident angle and radiation time, using MOβGal polycrystalline films with different thicknesses in order to obtain sufficient reciprocal data for identifying the lattice constants with conventional X-ray sources. Complementary uses of GIXD with a two-dimensional detector, with much higher incident angles than the total reflection angle using a NANO-Viewer system and out-of-plane and in-plane measurements using SmartLab, enabled us to determine the complete lattice parameters for the MOβGal hemihydrate crystalline film.

  12. Dielectric Behavior of Ceramic (BST/Epoxy Thick Films

    Directory of Open Access Journals (Sweden)

    N. Hadik

    2009-01-01

    Full Text Available Composite materials were made by mixing powders of Ba1−xSrxTiO3 (x=0.2 and 0.4 ceramics and epoxy resin with various volume fractions (vol%. Dielectric measurements of these composites were performed as a function of filler ratio in the range 100–360°K at 10 KHz. The dielectric constant of the composite increased with increasing volume fraction varies slightly with temperature. The 20 vol% of BST(0.4-epoxy composite had the highest dielectric constant of 19.4 and dielectric loss tangent of 0.027. Among the dielectric mixing models presented, the model of Lichtenecker shows the best fit to the experimental data for both composites.

  13. A method for thickness determination of thin films of amalgamable metals by total-reflection X-ray fluorescence

    International Nuclear Information System (INIS)

    Bennun, L.; Greaves, E.D.; Barros, H.; Diaz-Valdes, J.

    2009-01-01

    A method for thickness determination of thin amalgamable metallic films by total-reflection X-ray fluorescence (TXRF) is presented. The peak's intensity in TXRF spectra are directly related to the surface density of the sample, i.e. to its thickness in a homogeneous film. Performing a traditional TXRF analysis on a thin film of an amalgamated metal, and determining the relative peak intensity of a specific metal line, the layer thickness can be precisely obtained. In the case of gold thickness determination, mercury and gold peaks overlap, hence we have developed a general data processing scheme to achieve the most precise results.

  14. Thickness-dependent piezoelectric behaviour and dielectric properties of lanthanum modified BiFeO3 thin films

    Directory of Open Access Journals (Sweden)

    Glenda Biasotto

    2011-03-01

    Full Text Available Bi0.85La0.15FeO3 (BLFO thin films were deposited on Pt(111/Ti/SiO2 /Si substrates by the soft chemical method. Films with thicknesses ranging from 140 to 280 nm were grown on platinum coated silicon substrates at 500°C for 2 hours. The X-ray diffraction analysis of BLFO films evidenced a hexagonal structure over the entire thickness range investigated. The grain size of the film changes as the number of the layers increases, indicating thickness dependence. It is found that the piezoelectric response is strongly influenced by the film thickness. It is shown that the properties of BiFeO3 thin films, such as lattice parameter, dielectric permittivity, piezoeletric coefficient etc., are functions of misfit strains.

  15. FEM Modeling of In-Plane Stress Distribution in Thick Brittle Coatings/Films on Ductile Substrates Subjected to Tensile Stress to Determine Interfacial Strength

    Directory of Open Access Journals (Sweden)

    Kaishi Wang

    2018-03-01

    Full Text Available The ceramic-metal interface is present in various material structures and devices that are vulnerable to failures, like cracking, which are typically due to their incompatible properties, e.g., thermal expansion mismatch. In failure of these multilayer systems, interfacial shear strength is a good measure of the robustness of interfaces, especially for planar films. There is a widely-used shear lag model and method by Agrawal and Raj to analyse and measure the interfacial shear strength of thin brittle film on ductile substrates. The use of this classical model for a type of polymer derived ceramic coatings (thickness ~18 μm on steel substrate leads to high values of interfacial shear strength. Here, we present finite element simulations for such a coating system when it is subjected to in-plane tension. Results show that the in-plane stresses in the coating are non-uniform, i.e., varying across the thickness of the film. Therefore, they do not meet one of the basic assumptions of the classical model: uniform in-plane stress. Furthermore, effects of three significant parameters, film thickness, crack spacing, and Young’s modulus, on the in-plane stress distribution have also been investigated. ‘Thickness-averaged In-plane Stress’ (TIS, a new failure criterion, is proposed for estimating the interfacial shear strength, which leads to a more realistic estimation of the tensile strength and interfacial shear strength of thick brittle films/coatings on ductile substrates.

  16. Thick-film textile-based amperometric sensors and biosensors.

    Science.gov (United States)

    Yang, Yang-Li; Chuang, Min-Chieh; Lou, Shyh-Liang; Wang, Joseph

    2010-06-01

    The incorporation of amperometric sensors into clothing through direct screen-printing onto the textile substrate is described. Particular attention is given to electrochemical sensors printed directly on the elastic waist of underwear that offers tight direct contact with the skin. The textile-based printed carbon electrodes have a well-defined appearance with relatively smooth conductor edges and no apparent defects or cracks. Convenient voltammetric and chronoamperometric measurements of 0-3 mM ferrocyanide, 0-25 mM hydrogen peroxide, and 0-100 muM NADH have been documented. The favorable electrochemical behavior is maintained under folding or stretching stress, relevant to the deformation of clothing. The electrochemical performance and tolerance to mechanical stress are influenced by the physical characteristics of the textile substrate. The results indicate the potential of textile-based screen-printed amperometric sensors for future healthcare, sport or military applications. Such future applications would benefit from tailoring the ink composition and printing conditions to meet the specific requirements of the textile substrate.

  17. High-precision thickness measurements using beta backscatter

    International Nuclear Information System (INIS)

    Heckman, R.V.

    1978-11-01

    A two-axis, automated fixture for use with a high-intensity Pm-147 source and a photomultiplier-scintillation beta-backscatter probe for making thickness measurements has been designed and built. A custom interface was built to connect the system to a minicomputer, and software was written to position the tables, control the probe, and make the measurements. Measurements can be made in less time with much greater precision than by the method previously used

  18. Physical Properties, Film Thickness, and Bond Strengths of Resin-Modified Glass Ionomer Cements According to Their Delivery Method.

    Science.gov (United States)

    Sulaiman, Taiseer A; Abdulmajeed, Awab A; Altitinchi, Ali; Ahmed, Sumitha N; Donovan, Terence E

    2018-03-05

    To determine the effect of changing the dispensing or mixing method of resin-modified glass ionomer (RMGI) cements on their water sorption, solubility, film thickness, and shear bond strength. Disc-shaped specimens of RMGI cements (RelyX: Luting [handmix], Luting Plus [clicker-handmix], Luting Plus [automix], GC: Fuji PLUS [capsule-automix], FujiCEM 2 [automix], [n = 10]) were prepared according to ISO standard 4049 for water sorption and solubility tests. Furthermore, the percentage of mass change, percentage of solubility, and percentage of water absorbed was also determined. Film thickness was measured according to ISO standard 9917-2; the mean of 5 measurements for each cement was calculated. Shear bond strength for each cement was determined according to ISO standard 29022 before and after thermocycling at 20,000 cycles, temperatures 5 to 55°C with a 15-second dwell time (n = 10/subgroup). Two- and one-way ANOVA were used to analyze data for statistical significance (p 0.05). RelyX Luting Plus (clicker-handmix) displayed lower solubility than its handmix and automix counterparts (p < 0.05). Film thickness of RelyX cements was significantly different (p < 0.05). RelyX Luting Plus (automix) had the lowest film thickness (19 μm) compared to its handmix (48 μm) and clicker-handmix (117 μm) counterparts (p < 0.05). GC Fuji PLUS (capsule-automix, 22 μm) was significantly lower than the automix version (GC FujiCEM 2, 127 μm) (p < 0.05). Shear bond strength of RelyX Luting Plus (automix) was significantly lower than its handmix and clicker-handmix versions (p < 0.05). GC Fuji PLUS (capsule-automix) was significantly higher than GC FujiCEM 2 (automix) (p < 0.05). The binary interaction of the two independent variables (dispensing/mixing method and thermocycling) was significant for the shear bond strengths of the GC cements only (p < 0.05). Change in the dispensing/mixing method of RMGI cement from the same brand may have an effect on its physical properties

  19. Tuning the Anisotropy of In-Plane Thermal Conduction in Thin Films by Modulating Thickness

    Science.gov (United States)

    Zeng, Yuqiang; Marconnet, Amy

    2018-01-01

    Anisotropy in thermal conductivity is promising for directing the heat-flow pathways in modern applications including thermal management of electronic devices. While some materials, like graphite, have strong anisotropy when comparing the in-plane thermal conductivity to cross-plane thermal conductivity, few naturally occurring materials have significant anisotropy within the in-plane directions, with an anisotropy ratio of ˜3 in few-layer black phosphorus being among the highest. In this Letter, we propose to control the thermal-conduction anisotropy by periodically modulating the thickness of thin films. Specifically, we model the thermal conduction in silicon-based thickness-modulated films using full three-dimensional simulations based on the phonon frequency-dependent Boltzmann transport equation. Our simulations demonstrate that phonon scattering with appropriately sized and shaped thickness-modulation features leads to a significant anisotropy in thermal conduction. In the diffusive regime, the same types of features lead to relatively low anisotropy (as calculated using the conventional heat diffusion equation). Thus, the enhanced thermal-conduction anisotropy with small features comes from the phonon scattering and size effects. Modulating the thickness of the thin films allows tuning the thermal-anisotropy ratio across an order of magnitude. Moreover, the proposed structures can be fabricated with currently available silicon-based nanofabrication techniques, without the need for exotic or expensive materials.

  20. The head for coatings thickness measurement, especially for printed circuits

    International Nuclear Information System (INIS)

    Sazonow, M.; Kunicki, B.; Urbanski, P.

    1992-01-01

    The new construction of measuring head for coating thickness especially for printed circuits has been worked out. The measuring head have got the beta source and G-M detector mounted in movable seat. The change of detector position enables precision fixing of the detail in the diagram hole before the measurement. The measuring area can be observed in the mirror. After controlling the proper detail position the detector come back to their measuring position fixed by spring and then is ready to measure. 2 figs

  1. Optical properties of large-area MoS2 thin films grown via magnetron sputtering: Thickness and substrate dependence

    Science.gov (United States)

    Alkabsh, Asma; Samassekou, Hassana; Mazumdar, Dipanjan

    Transition metal dichalcogenides (TMDS) have gained exceptional attention because of their thickness dependent electronic structure which makes them suitable for electronic and optoelectronic applications. MoS2 is among the most promising material in this family. Recently we have successfully developed growth of large-area MoS2 using magnetron sputtering. In this work, we investigated the large-area optical properties of few and bilayer MoS2 grown on different amorphous underlayers (BN and SiO2) using spectroscopic ellipsometry (SE), UV-VIS and Raman spectroscopy. SE spectra provided thickness and optical constants within 1.0-3.0 eV range, whereas broadband (0.5-6.5 eV) transmission and reflectance measurements provided direct measurements of optical constants through Glover-Tinkham analysis. A comprehensive analysis of thickness and substance dependence of optical properties of our large-area films will be presented and compared with existing literature reports and first-principles electronic structure. Also, Raman measurements reveal interesting disorder related effects on our MoS2 films.

  2. Thickness-controlled direct growth of nanographene and nanographite film on non-catalytic substrates.

    Science.gov (United States)

    Du, Lei; Yang, Liu; Hu, Zhiting; Zhang, Jiazhen; Huang, Chunlai; Sun, Liaoxin; Wang, Lin; Wei, Dacheng; Gang, Chen; Lu, Wei

    2018-03-07

    Metal-catalysed chemical vapor deposition has been broadly employed for large-scale production of high-quality graphene. However, a following transfer process to targeted substrates is needed, which is incompatible with current silicon technology. We here report a new chemical vapor deposition approach to form nanographene and nanographite films with accurate thickness control directly on non-catalytic substrates such as silicon dioxide and quartz at 800℃. The growth time is as short as a few seconds. The approach includes using 9-bis(diethylamino)silylanthracene as the carbon source and an atomic layer deposition controlling system. The structure of the formed nanographene and nanographite films were characterized using atomic force microscopy, high resolution transmission electron microscopy, Raman scattering, and X-ray photoemission spectroscopy. The nanographite film exhibits a transmittance higher than 80% at 550 nm and a sheet electrical resistance of 2000 ohms per square at room temperature. A negative temperature-dependence of the resistance of the nanographite film is also observed. Moreover, the thickness of the films can be precisely controlled via the deposition cycles using an atomic layer deposition system, which promotes great application potential for optoelectronic and thermoelectronic-devices. © 2018 IOP Publishing Ltd.

  3. Thickness-controlled direct growth of nanographene and nanographite film on non-catalytic substrates

    Science.gov (United States)

    Du, Lei; Yang, Liu; Hu, Zhiting; Zhang, Jiazhen; Huang, Chunlai; Sun, Liaoxin; Wang, Lin; Wei, Dacheng; Chen, Gang; Lu, Wei

    2018-05-01

    Metal-catalyzed chemical vapor deposition (CVD) has been broadly employed for large-scale production of high-quality graphene. However, a following transfer process to targeted substrates is needed, which is incompatible with current silicon technology. We here report a new CVD approach to form nanographene and nanographite films with accurate thickness control directly on non-catalytic substrates such as silicon dioxide and quartz at 800 °C. The growth time is as short as a few seconds. The approach includes using 9-bis(diethylamino)silylanthracene as the carbon source and an atomic layer deposition (ALD) controlling system. The structure of the formed nanographene and nanographite films were characterized using atomic force microscopy, high resolution transmission electron microscopy, Raman scattering, and x-ray photoemission spectroscopy. The nanographite film exhibits a transmittance higher than 80% at 550 nm and a sheet electrical resistance of 2000 ohms per square at room temperature. A negative temperature-dependence of the resistance of the nanographite film is also observed. Moreover, the thickness of the films can be precisely controlled via the deposition cycles using an ALD system, which promotes great application potential for optoelectronic and thermoelectronic-devices.

  4. THE THICKNESS DEPENDENCE OF OXYGEN PERMEABILITY IN SOL-GEL DERIVED CGO-COFE2O4 THIN FILMS ON POROUS CERAMIC SUBSTRATES: A SPUTTERED BLOCKING LAYER FOR THICKNESS CONTROL

    Energy Technology Data Exchange (ETDEWEB)

    Brinkman, K

    2009-01-08

    Mixed conductive oxides are a topic of interest for applications in oxygen separation membranes as well as use in producing hydrogen fuel through the partial oxidation of methane. The oxygen flux through the membrane is governed both by the oxygen ionic conductivity as well as the material's electronic conductivity; composite membranes like Ce{sub 0.8}Gd{sub 0.2}O{sub 2-{delta}} (CGO)-CoFe{sub 2}O{sub 4} (CFO) use gadolinium doped ceria oxides as the ionic conducting material combined with cobalt iron spinel which serves as the electronic conductor. In this study we employ {approx} 50 nm sputtered CeO{sub 2} layers on the surface of porous CGO ceramic substrates which serve as solution 'blocking' layers during the thin film fabrication process facilitating the control of film thickness. Films with thickness of {approx} 2 and 4 microns were prepared by depositing 40 and 95 separate sol-gel layers respectively. Oxygen flux measurements indicated that the permeation increased with decreasing membrane thickness; thin film membrane with thickness on the micron level showed flux values an order of magnitude greater (0.03 {micro}mol/cm{sup 2} s) at 800 C as compared to 1mm thick bulk ceramic membranes (0.003 {micro}mol/cm{sup 2}).

  5. The effect of hydrogen on the conductivity of Ag-Pd thick film resistors

    Science.gov (United States)

    Aleksandrov, V. A.; Kalyuzhnyi, D. G.; Aleksandrovich, E. V.

    2013-01-01

    The resistance of silver-palladium thick film resistors decreases and their surface conduction type changes upon heating in a flow of hydrogen at temperatures within 50-100°C or hydrogenation in an aqueous acid electrolyte at room temperature. These effects are due to the reduction of PdO (present in the Ag-Pd film) to Pd by hydrogen entering into the resistor material. In the electrolyte, the resistance of samples starts decreasing at the moment of the current being switched on.

  6. Analysis of thickness of a hydrophobic fluoropolymer film based on electrowetting.

    Science.gov (United States)

    Ko, Hyojin; Phan, Minh Dinh; Khatua, Dibyendu; Jung, Chan-Hee; Choi, Jae-Hak; Kwon, Oh-Sun; Shin, Kwanwoo

    2013-07-01

    The electrowetting of water drops on a dielectric fluoropolymer film was studied experimentally. The dependence of the contact angles of the water drops on the applied voltage has been well explained in the low-voltage limit by using the classical Young-Lippmann theory. With this theory, the thicknesses of films coated on glass substrates by using a spin-coater were obtained indirectly by fitting the contact angle data and were confirmed by using X-ray reflectometry. The two sets of results showed a good agreement. In addition, we confirmed that the contact angle saturation at high voltage were consistent with Peykov's model.

  7. Thickness dependent structural order in P3HT films - a key parameter for high OFET mobility

    Energy Technology Data Exchange (ETDEWEB)

    Gburek, Benedikt; Sharma, Richa; Balster, Torsten; Wagner, Veit [School of Engineering and Science, Jacobs University Bremen (Germany)

    2010-07-01

    Applications of organic electronics require cheap and fast production methods on flexible substrates. Following these goals, top-gate OFETs on PET foils were used to analyze the dependence of the device characteristics on the crucial parameter of semiconductor layer thickness. The organic semiconductor, regio-regular P3HT, and the gate insulator were deposited by spin-coating under atmospheric conditions. The charge carrier mobility was found to be rather low for extremely thin layers of several nanometers only. However, with increasing layer thickness, mobility increases by two orders of magnitude until a ''saturation thickness'' of 50 nm, above which it remains constant. Further details of the ordering were extracted according to the Vissenberg-Matters model with gate-voltage dependent mobility {mu}={mu}{sub 0}((V{sub GS}-V{sub th})/1V){sup {gamma}}, where {gamma} is directly related to the width of the density of states. The analysis reveals that the disorder parameter {gamma} decreases from 3.1 to 1.0 over the examined thickness range, which explains the low mobility of thinner films by higher energetic disorder. This analysis proves to be highly advantageous as it represents the whole transfer curve, gives better comparability and offers more physical insight. Our study demonstrates the crucial role of layer thickness tuning for improved film structure and optimum material performance.

  8. Enhancing Performance of Large-Area Organic Solar Cells with Thick Film via Ternary Strategy.

    Science.gov (United States)

    Zhang, Jianqi; Zhao, Yifan; Fang, Jin; Yuan, Liu; Xia, Benzheng; Wang, Guodong; Wang, Zaiyu; Zhang, Yajie; Ma, Wei; Yan, Wei; Su, Wenming; Wei, Zhixiang

    2017-06-01

    Large-scale fabrication of organic solar cells requires an active layer with high thickness tolerability and the use of environment-friendly solvents. Thick films with high-performance can be achieved via a ternary strategy studied herein. The ternary system consists of one polymer donor, one small molecule donor, and one fullerene acceptor. The small molecule enhances the crystallinity and face-on orientation of the active layer, leading to improved thickness tolerability compared with that of a polymer-fullerene binary system. An active layer with 270 nm thickness exhibits an average power conversion efficiency (PCE) of 10.78%, while the PCE is less than 8% with such thick film for binary system. Furthermore, large-area devices are successfully fabricated using polyethylene terephthalate (PET)/Silver gride or indium tin oxide (ITO)-based transparent flexible substrates. The product shows a high PCE of 8.28% with an area of 1.25 cm 2 for a single cell and 5.18% for a 20 cm 2 module. This study demonstrates that ternary organic solar cells exhibit great potential for large-scale fabrication and future applications. © 2017 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

  9. Effect of sputtered lanthanum hexaboride film thickness on field emission from metallic knife edge cathodes

    Energy Technology Data Exchange (ETDEWEB)

    Kirley, M. P.; Novakovic, B.; Sule, N.; Weber, M. J.; Knezevic, I.; Booske, J. H. [Department of Electrical and Computer Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706 (United States)

    2012-03-15

    We report experiments and analysis of field emission from metallic knife-edge cathodes, which are sputter-coated with thin films of lanthanum hexaboride (LaB{sub 6}), a low-work function material. The emission current is found to depend sensitively on the thickness of the LaB{sub 6} layer. We find that films thinner than 10 nm greatly enhance the emitted current. However, cathodes coated with a thicker layer of LaB{sub 6} are observed to emit less current than the uncoated metallic cathode. This result is unexpected due to the higher work function of the bare metal cathode. We show, based on numerical calculation of the electrostatic potential throughout the structure, that the external (LaB{sub 6}/vacuum) barrier is reduced with respect to uncoated samples for both thin and thick coatings. However, this behavior is not exhibited at the internal (metal/LaB{sub 6}) barrier. In thinly coated samples, electrons tunnel efficiently through both the internal and external barrier, resulting in current enhancement with respect to the uncoated case. In contrast, the thick internal barrier in thickly coated samples suppresses current below the value for uncoated samples in spite of the lowered external barrier. We argue that this coating thickness variation stems from a relatively low (no higher than 10{sup 18} cm{sup -3}) free carrier density in the sputtered polycrystalline LaB{sub 6}.

  10. Measurements of proton energy spectra using a radiochromic film stack

    Science.gov (United States)

    Filkins, T. M.; Steidle, Jessica; Ellison, D. M.; Steidle, Jeffrey; Freeman, C. G.; Padalino, S. J.; Fiksel, G.; Regan, S. P.; Sangster, T. C.

    2014-10-01

    The energy spectrum of protons accelerated from the rear-side of a thin foil illuminated with ultra-intense laser light from the OMEGA EP laser system at the University of Rochester's Laboratory for Laser Energetics (LLE) was measured using a stack of radiochromic film (RCF). The film stack consisted of four layers of Gafchromic HD-V2 film and four layers of Gafchromic MD-V2-55 film. Aluminum foils of various thicknesses were placed between each piece of RCF in the stack. This arrangement allowed protons with energies of 30 MeV to reach the back layer of RCF in the stack. The stack was placed in the detector plane of a Thomson parabola ion energy (TPIE) spectrometer. Each piece of film in the stack was scanned using a commercially available flat-bed scanner (Epson 10000XL). The resulting optical density was converted into proton fluence using an absolute calibration of the RCF obtained at the SUNY Geneseo 1.7 MV Pelletron accelerator laboratory. In these calibration measurements, the sensitivity of the radiochromic film was measured using monoenergetic protons produced by the accelerator. Details of the analysis procedure and the resulting proton energy spectra will be presented. Funded in part by a grant from the DOE through the Laboratory for Laser Energetics.

  11. Highly accurate adaptive TOF determination method for ultrasonic thickness measurement

    Science.gov (United States)

    Zhou, Lianjie; Liu, Haibo; Lian, Meng; Ying, Yangwei; Li, Te; Wang, Yongqing

    2018-04-01

    Determining the time of flight (TOF) is very critical for precise ultrasonic thickness measurement. However, the relatively low signal-to-noise ratio (SNR) of the received signals would induce significant TOF determination errors. In this paper, an adaptive time delay estimation method has been developed to improve the TOF determination’s accuracy. An improved variable step size adaptive algorithm with comprehensive step size control function is proposed. Meanwhile, a cubic spline fitting approach is also employed to alleviate the restriction of finite sampling interval. Simulation experiments under different SNR conditions were conducted for performance analysis. Simulation results manifested the performance advantage of proposed TOF determination method over existing TOF determination methods. When comparing with the conventional fixed step size, and Kwong and Aboulnasr algorithms, the steady state mean square deviation of the proposed algorithm was generally lower, which makes the proposed algorithm more suitable for TOF determination. Further, ultrasonic thickness measurement experiments were performed on aluminum alloy plates with various thicknesses. They indicated that the proposed TOF determination method was more robust even under low SNR conditions, and the ultrasonic thickness measurement accuracy could be significantly improved.

  12. Computer vision based nacre thickness measurement of Tahitian pearls

    Science.gov (United States)

    Loesdau, Martin; Chabrier, Sébastien; Gabillon, Alban

    2017-03-01

    The Tahitian Pearl is the most valuable export product of French Polynesia contributing with over 61 million Euros to more than 50% of the total export income. To maintain its excellent reputation on the international market, an obligatory quality control for every pearl deemed for exportation has been established by the local government. One of the controlled quality parameters is the pearls nacre thickness. The evaluation is currently done manually by experts that are visually analyzing X-ray images of the pearls. In this article, a computer vision based approach to automate this procedure is presented. Even though computer vision based approaches for pearl nacre thickness measurement exist in the literature, the very specific features of the Tahitian pearl, namely the large shape variety and the occurrence of cavities, have so far not been considered. The presented work closes the. Our method consists of segmenting the pearl from X-ray images with a model-based approach, segmenting the pearls nucleus with an own developed heuristic circle detection and segmenting possible cavities with region growing. Out of the obtained boundaries, the 2-dimensional nacre thickness profile can be calculated. A certainty measurement to consider imaging and segmentation imprecisions is included in the procedure. The proposed algorithms are tested on 298 manually evaluated Tahitian pearls, showing that it is generally possible to automatically evaluate the nacre thickness of Tahitian pearls with computer vision. Furthermore the results show that the automatic measurement is more precise and faster than the manual one.

  13. Influence of the thickness of BiFeO3 on the ferromagnet properties of layered multiferroic CoFe2O4-BiFeO3 films

    Science.gov (United States)

    Liu, Y. Q.; Wu, Y. H.; Zhang, J.; Wei, M. B.; Liu, Y.; Li, D.; Yang, L. L.; Yang, J. H.

    2013-03-01

    Multiferroic layered films consisting of CoFe2O4-BiFeO3 (CFO-BFO) with increasing the thickness of BFO layer have been prepared on the LaNiO3 (LNO)-buffered Si (1 0 0) substrate via a simple spin-coating process. The thickness effects of BFO layer on the magnetic properties of CFO-BFO films have been investigated in detail. The X-ray diffraction results testify that magnetic CFO and ferroelectric BFO phases coexist in the heterostructured films. The HRTEM images show the well-defined microstructure of the CFO layer on LNO buffer. The magnetic measurement reveal that, with increasing the BFO thickness, the Ms of CFO-BFO films will be enhanced due to the stress. The film with 400 nm thickness BFO layers demonstrates the highest Ms value of 230 emu/cm3, which exhibits 137.1% enhancement than that of the film without BFO layers.

  14. Resonance-type thickness dependence of optical second-harmonic generation in thin films of the topological insulator B i2S e3

    Science.gov (United States)

    Glinka, Yuri D.; Babakiray, Sercan; Johnson, Trent A.; Holcomb, Mikel B.; Lederman, David

    2015-05-01

    Optical second-harmonic generation (SHG) has been measured in a reflection from the nanometer-thick films (6 to 40 nm) of the topological insulator B i2S e3 using 1.51 eV (820 nm) Ti:Sapphire laser photons and revealed a strong dependence of the integral SHG intensity on the film thickness. The integral SHG intensity was determined by area integration of the SHG rotational anisotropy patterns measured for different input-output light polarization geometries. A ˜100-fold enhancement of the integral SHG intensity with decreasing film thickness has been suggested to result from the dc-electric-field-induced SHG (EFISHG) effects. Two sources of dynamically created dc electric field were proposed: (i) the capacitor-type dc electric field that gradually increases with decreasing film thickness from 40 to 6 nm due to a dynamical imbalance of photoexcited long-lived carriers between the opposite-surface Dirac surface states and (ii) a dc electric field associated with a nonlinearly excited Dirac plasmon, which is responsible for the resonant enhancement of the integral SHG intensity for the 10 nm thick film with a Lorentz-shaped resonance of ˜1.6 nm full width at half maximum. In addition to the general SHG enhancement trends with decreasing film thickness, a relative decrease of the out-of-plane contribution with respect to the in-plane contribution was observed. Using a theoretical treatment of the measured SHG rotational anisotropy patterns, this effect has been suggested to result from the joint contributions of the linear and quadratic dc electric field effects to the EFISHG response.

  15. Ferroelectric domain inversion and its stability in lithium niobate thin film on insulator with different thicknesses

    Energy Technology Data Exchange (ETDEWEB)

    Shao, Guang-hao; Bai, Yu-hang; Cui, Guo-xin; Li, Chen; Qiu, Xiang-biao; Wu, Di; Lu, Yan-qing, E-mail: yqlu@nju.edu.cn [National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences, and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093 (China); Geng, De-qiang [Jinan Jingzheng Electronics Co., Ltd., Jinan 250100 (China)

    2016-07-15

    Ferroelectric domain inversion and its effect on the stability of lithium niobate thin films on insulator (LNOI) are experimentally characterized. Two sets of specimens with different thicknesses varying from submicron to microns are selected. For micron thick samples (∼28 μm), domain structures are achieved by pulsed electric field poling with electrodes patterned via photolithography. No domain structure deterioration has been observed for a month as inspected using polarizing optical microscopy and etching. As for submicron (540 nm) films, large-area domain inversion is realized by scanning a biased conductive tip in a piezoelectric force microscope. A graphic processing method is taken to evaluate the domain retention. A domain life time of 25.0 h is obtained and possible mechanisms are discussed. Our study gives a direct reference for domain structure-related applications of LNOI, including guiding wave nonlinear frequency conversion, nonlinear wavefront tailoring, electro-optic modulation, and piezoelectric devices.

  16. Evaluation of Cadmium-Free Thick Film Materials on Alumina Substrates

    Energy Technology Data Exchange (ETDEWEB)

    L. H. Perdieu

    2009-09-01

    A new cadmium-free material system was successfully evaluated for the fabrication of thick film hybrid microcircuits at Honeywell Federal Manufacturing & Technologies (FM&T). The characterization involved screen printing, drying and firing two groups of resistor networks which were made using the current material system and the cadmium-free material system. Electrical, environmental and adhesion tests were performed on both groups to determine the more suitable material system. Additionally, untrimmed test coupons were evaluated to further characterize the new materials. The cadmiumfree material system did as well or better than the current material system. Therefore, the new cadmium-free material system was approved for use on production thick film product.

  17. DETERMINATION OF LIQUID FILM THICKNESS FOLLOWING DRAINING OF CONTACTORS, VESSELS, AND PIPES IN THE MCU PROCESS

    International Nuclear Information System (INIS)

    Poirier, M; Fernando Fondeur, F; Samuel Fink, S

    2006-01-01

    The Department of Energy (DOE) identified the caustic side solvent extraction (CSSX) process as the preferred technology to remove cesium from radioactive waste solutions at the Savannah River Site (SRS). As a result, Washington Savannah River Company (WSRC) began designing and building a Modular CSSX Unit (MCU) in the SRS tank farm to process liquid waste for an interim period until the Salt Waste Processing Facility (SWPF) begins operations. Both the solvent and the strip effluent streams could contain high concentrations of cesium which must be removed from the contactors, process tanks, and piping prior to performing contactor maintenance. When these vessels are drained, thin films or drops will remain on the equipment walls. Following draining, the vessels will be flushed with water and drained to remove the flush water. The draining reduces the cesium concentration in the vessels by reducing the volume of cesium-containing material. The flushing, and subsequent draining, reduces the cesium in the vessels by diluting the cesium that remains in the film or drops on the vessel walls. MCU personnel requested that Savannah River National Laboratory (SRNL) researchers conduct a literature search to identify models to calculate the thickness of the liquid films remaining in the contactors, process tanks, and piping following draining of salt solution, solvent, and strip solution. The conclusions from this work are: (1) The predicted film thickness of the strip effluent is 0.010 mm on vertical walls, 0.57 mm on horizontal walls and 0.081 mm in horizontal pipes. (2) The predicted film thickness of the salt solution is 0.015 mm on vertical walls, 0.74 mm on horizontal walls, and 0.106 mm in horizontal pipes. (3) The predicted film thickness of the solvent is 0.022 mm on vertical walls, 0.91 mm on horizontal walls, and 0.13 mm in horizontal pipes. (4) The calculated film volume following draining is: (a) Salt solution receipt tank--1.6 gallons; (b) Salt solution feed

  18. Thickness Dependence of Magnetic Relaxation and E-J Characteristics in Superconducting (Gd-Y)-Ba-Cu-O Films with Strong Vortex Pinning

    Energy Technology Data Exchange (ETDEWEB)

    Polat, Ozgur [ORNL; Sinclair IV, John W [ORNL; Zuev, Yuri L [ORNL; Thompson, James R [ORNL; Christen, David K [ORNL; Cook, Sylvester W [ORNL; Kumar, Dhananjay [ORNL; Chen, Y [SuperPower Incorporated, Schenectady, New York; Selvamanickam, V. [SuperPower Incorporated, Schenectady, New York

    2011-01-01

    The dependence of the critical current density Jc on temperature, magnetic field, and film thickness has been investigated in (Gd-Y)BaCu-oxide materials of 0.7, 1.4, and 2.8 m thickness. Generally, the Jc decreases with film thickness at investigated temperatures and magnetic fields. The nature and strength of the pinning centers for vortices have been identified through angular and temperature measurements, respectively. These films do not exhibit c-axis correlated vortex pinning, but do have correlated defects oriented near the ab-planes. For all film thicknesses studied, strong pinning dominates at most temperatures. The vortex dynamics were investigated through magnetic relaxation studies in the temperature range of 5 77 K in 1 T and 3 T applied magnetic fields, H || surface-normal. The creep rate S is thickness dependent at high temperatures, implying that the pinning energy is also thickness dependent. Maley analyses of the relaxation data show an inverse power law variation for the effective pinning energy Ueff ~ (J0/J) . Finally, the electric field-current density (E-J) characteristics were determined over a wide range of dissipation by combining experimental results from transport, swept field magnetometry (VSM), and Superconducting Quantum Interference Device (SQUID) magnetometry. We develop a self-consistent model of the combined experimental results, leading to an estimation of the critical current density Jc0(T) in the absence of flux creep.

  19. Effect of substrate and antiferromagnetic film's thickness on exchange-bias field (invited)

    Science.gov (United States)

    Allegranza, Oletta; Chen, Mao-Min

    1993-05-01

    In this work, we studied the effect of different substrates and the thickness dependence of the antiferromagnetic layer on the exchange-bias field, created through interfacial exchange coupling between NiFe and FeMn. The substrates considered were glass and a metallic underlayer, such as Ta, on glass. We noticed different behaviors of the two types of films when annealed in a magnetic field at 240 °C and we carefully looked at their temperature dependence, observing that the blocking temperature, at which the exchange-bias field goes to zero, decreases with increasing FeMn thickness. We also found that, when reducing the antiferromagnetic film's thickness, the exchange-bias field of the annealed NiFe/FeMn structure improves on both types of substrate. Since a low blocking temperature is undesirable, we developed a method to take advantage of the thinner FeMn film's properties and to compensate the decrease in blocking temperature. The FeMn was deposited in two separate layers. The first layer, at the NiFe interface, was sputtered in pure Ar, and the second in an Ar/O2 or Ar/N2 mixture. The advantage of this technique was particularly impressive for films deposited on Ta over glass, where a factor of 2 improvement in exchange bias field was obtained at both room temperature and 80 °C, when compared to the structure with the same total antiferromagnetic material's thickness deposited in one single layer. Blocking temperatures were above 150 °C.

  20. Investigation of Polymer Thick-film Piezoresistors for Medical Wrist Rehabilitation and Artificial Knee Load Sensors

    OpenAIRE

    Jacq, Caroline; Maeder, Thomas; Emery, Simon; Simoncini, Matteo; Meurville, Eric; Ryser, Peter

    2014-01-01

    Readily-available and low-cost commercial polymer-based composite materials, such as standard epoxy-fibreglass printed circuit board (PCB) substrates and resin-carbon thick-film piezoresistors, were evaluated as a solution for medical force sensors, such as a wrist rehabilitation device and an implantable wireless artificial knee force sensor. We show that such materials have high sensitivity, and sufficient short-term stability – provided careful mechanical design and materials selection are...

  1. Thickness-Dependent Properties of YBCO Films Grown on GZO/CLO-Buffered NiW Substrates

    DEFF Research Database (Denmark)

    Malmivirta, M.; Huhtinen, H.; Yue, Zhao

    2017-01-01

    To study the role of novel Gd2Zr2O7/Ce0.9La0.1O2 buffer layer structure on a biaxially textured NiW substrate, a set of YBa2Cu3O7−δ (YBCO) films with different thicknesses were prepared by pulsed laser deposition (PLD). Interface imperfections as well as thickness-dependent structural properties...... were observed in the YBCO thin films. The structure is also reflected into the improved superconducting properties with the highest critical current densities in films with intermediate thicknesses. Therefore,it can be concluded that the existing buffer layers need more optimization before they can...... be successfully used for films with various thicknesses. This issue is linked to the extremely susceptible growth method of PLD when compared to the commonly used chemical deposition methods. Nevertheless, PLD-grown films can give a hint on what to concentrate to be able to further improve the buffer layer...

  2. Design and construction of a device for elaborate films of Vyns or Cellulose with control thickness

    International Nuclear Information System (INIS)

    Patlan C, F.

    1998-01-01

    This work is a part of the studies about the elaboration of reference radioactive sources, which are done in the National Institute of Nuclear Research in Mexico. Specially concerns with the elaboration of α-β radioactive sources. The importance of this work is because their applications increase day by day. Medicine, engineering, agriculture and even the arts cannot escape to the influence and impact of the nuclear sciences. But, what are the radioactive sources?, what is a holder of a radioactive source?, why we elaborate holders with special materials?, which is the best technique to elaborate them?. These topics are commented in this work. The material is as follows: the introduction and objective are described in chapter one. The second chapter deals with concepts about atomic and molecular structures, general description of nuclear radiation and their characteristics, comments about radioactive law decay, interaction of the alpha particles with the matter and a short description about surface barrier detectors. The different methods for elaborate a radioactive source holders are described in the chapter three. This same chapter speaks the topic about the elaboration of vyns or cellulose films and a device is proposed for make them; are some methods described how to take measure of their thickness. Chapter four shows the results, analysis and the respective conclusions. (Author)

  3. Functionalized Thick Film Impedance Sensors for Use in In Vitro Cell Culture

    Directory of Open Access Journals (Sweden)

    Heike Bartsch

    2018-04-01

    Full Text Available Multi-electrode arrays find application in electrophysiological recordings. The quality of the captured signals depends on the interfacial contact between electrogenic cells and the electronic system. Therefore, it requires reliable low-impedance electrodes. Low-temperature cofired ceramic technology offers a suitable platform for rapid prototyping of biological reactors and can provide both stable fluid supply and integrated bio-hardware interfaces for recordings in electrogenic cell cultures. The 3D assembly of thick film gold electrodes in in vitro bio-reactors has been demonstrated for neuronal recordings. However, especially when dimensions become small, their performance varies strongly. This work investigates the influence of different coatings on thick film gold electrodes with regard to their influence on impedance behavior. PEDOT:PSS layer, titanium oxynitride and laminin coatings are deposited on LTCC gold electrodes using different 2D and 3D MEA chip designs. Their impedance characteristics are compared and discussed. Titanium oxynitride layers emerged as suitable functionalization. Small 86-µm-electrodes have a serial resistance Rs of 32 kOhm and serial capacitance Cs of 4.1 pF at 1 kHz. Thick film gold electrodes with such coatings are thus qualified for signal recording in 3-dimensional in vitro cell cultures.

  4. Thickness dependence of microstructure in LaCaMnO thin films

    International Nuclear Information System (INIS)

    Gross, G.M.; Razavi, F.S.; Praus, R.B.; Habermeier, H.-U.

    2000-01-01

    Introducing biaxial strain in doped lanthanum manganite thin films is an excellent tool to modify the electrical and transport properties systematically by controlled changes of the microstructure on an atomic scale. We deposited La 2/3 Ca 1/3 MnO 3 thin films onto SrTiO 3 single-crystal substrates under reproducible conditions in an optimized pulsed laser deposition process. A thickness range of 40 to 500 nm was chosen for the manganite layers to investigate the variation of the average lattice parameters with thickness using X-ray diffraction. We re-investigated the samples after annealing to determine the structural aspects of the relaxation behavior of the layers. A second set of samples was prepared with an analogous in situ annealing process. AFM was applied to examine the morphology and grain size of the layers. Due to a thermally induced strain relaxation process the thicker films show a gradual approach of the out-of-plane lattice constant to the bulk ceramic value. Further relaxation could be achieved with an annealing at 900 deg. C for 1 h. Lattice parameter changes with varying thickness and annealing processes are correlated with transport and magnetic properties

  5. Functionalized Thick Film Impedance Sensors for Use in In Vitro Cell Culture.

    Science.gov (United States)

    Bartsch, Heike; Baca, Martin; Fernekorn, Uta; Müller, Jens; Schober, Andreas; Witte, Hartmut

    2018-04-05

    Multi-electrode arrays find application in electrophysiological recordings. The quality of the captured signals depends on the interfacial contact between electrogenic cells and the electronic system. Therefore, it requires reliable low-impedance electrodes. Low-temperature cofired ceramic technology offers a suitable platform for rapid prototyping of biological reactors and can provide both stable fluid supply and integrated bio-hardware interfaces for recordings in electrogenic cell cultures. The 3D assembly of thick film gold electrodes in in vitro bio-reactors has been demonstrated for neuronal recordings. However, especially when dimensions become small, their performance varies strongly. This work investigates the influence of different coatings on thick film gold electrodes with regard to their influence on impedance behavior. PSS layer, titanium oxynitride and laminin coatings are deposited on LTCC gold electrodes using different 2D and 3D MEA chip designs. Their impedance characteristics are compared and discussed. Titanium oxynitride layers emerged as suitable functionalization. Small 86-µm-electrodes have a serial resistance R s of 32 kOhm and serial capacitance C s of 4.1 pF at 1 kHz. Thick film gold electrodes with such coatings are thus qualified for signal recording in 3-dimensional in vitro cell cultures.

  6. Thickness control in electrophoretic deposition of WO{sub 3} nanofiber thin films for solar water splitting

    Energy Technology Data Exchange (ETDEWEB)

    Fang, Yuanxing; Lee, Wei Cheat; Canciani, Giacomo E.; Draper, Thomas C.; Al-Bawi, Zainab F. [Department of Chemistry, School of Life Sciences, University of Sussex, Brighton BN1 9QJ (United Kingdom); Bedi, Jasbir S. [School of Public Health & Zoonoses, Guru Angad Dev Veterinary and Animal Sciences University, Ludhiana 141004 Punjab (India); Perry, Christopher C. [Division of Biochemistry, School of Medicine, Loma Linda University, Loma Linda, CA 92350 (United States); Chen, Qiao, E-mail: qiao.chen@sussex.ac.uk [Department of Chemistry, School of Life Sciences, University of Sussex, Brighton BN1 9QJ (United Kingdom)

    2015-12-15

    Graphical abstract: - Highlights: • A novel method combining electrospinning and electrophoretic deposition was established for the creation of nanostructured semiconductor thin films. • The created thin films displayed a high chemical stability with a controllable thickness. • The PEC water splitting performance of the thin films was optimized by fine-tuning the thickness of the films. • A maximum photoconversion efficiency was achieved by 18 μm nanofibrous thin films. - Abstract: Electrophoretic deposition (EPD) of ground electrospun WO{sub 3} nanofibers was applied to create photoanodes with controlled morphology for the application of photoelectrochemical (PEC) water splitting. The correlations between deposition parameters and film thicknesses were investigated with theoretical models to precisely control the morphology of the nanostructured porous thin film. The photoconversion efficiency was further optimized as a function of film thickness. A maximum photoconversion efficiency of 0.924% from electrospun WO{sub 3} nanofibers that EPD deposited on a substrate was achieved at a film thickness of 18 μm.

  7. Effect of H2 Exposure on TiO2-based Ceramic Thick Films

    Directory of Open Access Journals (Sweden)

    Frade, J. R.

    1999-12-01

    Full Text Available Thick-film sensors based on TiO2 (anatase and rutile and composites of TiO2-Al2O3 and TiO2-Y2O3 have been tested for their electrical response on exposure to H2. Film d.c. resistance was measured in the temperature range 500-650ºC as a function of time and gas-phase composition (air, N2 and 10% H2 in an N2-based stream; the equilibrium gas-phase Po2 was simultaneously monitored with a ZrO2-based oxygen sensor. The detection mechanism of TiO2 to H2 involves the formation of fully ionised oxygen vacancies for both anatase and rutile. The addition of Al2O3 and Y2O3 did little to affect film sensitivity at the tested H2 concentration levels.Los sensores de lámina gruesa basados en TIO2 (Anatasa y rutilo y materiales compuestos de TiO2-Al203 y TiO2-Y2O3 han sido evaluados en función de su respuesta eléctrica a la exposición de H2. La resistencia d.c. de las láminas fue medida en el rango de temperaturas de 500-560ºC en función del tiempo y la composición de la fase gaseosa (aire, N2 y 10% H2 en un vapor basado en N2; el equilibrio de P02 de la fase gaseosa fue simultáneamente monitorizado con un sensor de oxígeno basado en ZrO2. El mecanismo de detección del H2 por el TiO2 incluye la formación de vacantes de oxígeno totalmente ionizadas por la anatasa y el rutilo. La adición de Al2O3 y Y2O3 apenas afecta la sensibilidad de la lámina en los niveles de H2 evaluados.

  8. MEH-PPV film thickness influenced fluorescent quenching of tip-coated plastic optical fiber sensors

    Science.gov (United States)

    Yusufu, A. M.; Noor, A. S. M.; Tamchek, N.; Abidin, Z. Z.

    2017-12-01

    The performance of plastic optical fiber sensors in detecting nitro aromatic explosives 1,4-dinitrobenzene (DNB) have been investigated by fluorescence spectroscopy and analyzed by using fluorescence quenching technique. The plastic optical fiber utilized is 90 degrees cut tip and dip-coated with conjugated polymer MEH-PPV poly[2-methoxy-5-(2-ethylhexyloxy)-1,4-phenylenevinylene] thin films for detection conjugants. The thicknesses of the MEH-PPV coating were varied to improvise the sensitivity whilst slowly reducing the fluorescence intensity. It was shown that fluorescence intensity from thinner film decreased by (82% in 40 s) in the presence of DNB signifying an improvement of 28% reduction with time 13 s less than that of the thicker film.

  9. Narrow thermal hysteresis of NiTi shape memory alloy thin films with submicrometer thickness

    Energy Technology Data Exchange (ETDEWEB)

    Hou, Huilong; Hamilton, Reginald F., E-mail: rfhamilton@psu.edu; Horn, Mark W. [Department of Engineering Science and Mechanics, The Pennsylvania State University, University Park, Pennsylvania 16802 (United States)

    2016-09-15

    NiTi shape memory alloy (SMA) thin films were fabricated using biased target ion beam deposition (BTIBD), which is a new technique for fabricating submicrometer-thick SMA thin films, and the capacity to exhibit shape memory behavior was investigated. The thermally induced shape memory effect (SME) was studied using the wafer curvature method to report the stress-temperature response. The films exhibited the SME in a temperature range above room temperature and a narrow thermal hysteresis with respect to previous reports. To confirm the underlying phase transformation, in situ x-ray diffraction was carried out in the corresponding phase transformation temperature range. The B2 to R-phase martensitic transformation occurs, and the R-phase transformation is stable with respect to the expected conversion to the B19′ martensite phase. The narrow hysteresis and stable R-phase are rationalized in terms of the unique properties of the BTIBD technique.

  10. Deposition of SrTiO3 films by electrophoresis with thickness and particle size control

    International Nuclear Information System (INIS)

    Junior, W.D.M.; Pena, A.F.V.; Souza, A.E.; Santos, G.T.A.; Teixeira, S.R.; Senos, A.M.R.; Longo, E.

    2012-01-01

    The SrTiO3 (ST) is a material that exhibits semiconducting characteristics and interesting electrical properties. In room temperature has a structure of high cubic symmetry. The size of the crystallites of this material directly influences this symmetry, changing its network parameters. ST nanoparticles are obtained by hydrothermal method assisted by microwave (MAH). ST films are prepared by electrophoretic deposition (EPD). Approximately 1 g of the powder is dissolved in 100 ml of acetone and 1.5 ml of triethanolamine. The stainless steel substrates are arranged horizontally in the solution. The depositions are performed for 1-10 min and subjected to a potential difference of 20-100 V. The films were characterized by x-ray diffraction (XRD) and atomic force microscopy (AFM). The characterizations show that it is possible to control both the thickness and size of the crystallites of the film depending on the deposition parameters adopted. (author)

  11. Performance Evaluation of an Oxygen Sensor as a Function of the Samaria Doped Ceria Film Thickness

    International Nuclear Information System (INIS)

    Sanghavi, Rahul P.; Nandasiri, Manjula I.; Kuchibhatla, Satyanarayana; Nachimuthu, Ponnusamy; Engelhard, Mark H.; Shutthanandan, V.; Jiang, Weilin; Thevuthasan, Suntharampillai; Kayani, Asghar N.; Prasad, Shalini

    2010-01-01

    The current demand in the automobile industry is in the control of air-fuel mixture in the combustion engine of automobiles. Oxygen partial pressure can be used as an input parameter for regulating or controlling systems in order to optimize the combustion process. Our goal is to identify and optimize the material system that would potentially function as the active sensing material for such a device that monitors oxygen partial pressure in these systems. We have used thin film samaria doped ceria (SDC) as the sensing material for the sensor operation, exploiting the fact that at high temperatures, oxygen vacancies generated due to samarium doping act as conducting medium for oxygen ions which hop through the vacancies from one side to the other contributing to an electrical signal. We have recently established that 6 atom% Sm doping in ceria films has optimum conductivity. Based on this observation, we have studied the variation in the overall conductivity of 6 atom% samaria doped ceria thin films as a function of thickness in the range of 50 nm to 300 nm at a fixed bias voltage of 2 volts. A direct proportionality in the increase in the overall conductivity is observed with the increase in sensing film thickness. For a range of oxygen pressure values from 1 mTorr to 100 Torr, a tolerable hysteresis error, good dynamic response and a response time of less than 10 seconds was observed

  12. Phase-Transfer Ligand Exchange of Lead Chalcogenide Quantum Dots for Direct Deposition of Thick, Highly Conductive Films.

    Science.gov (United States)

    Lin, Qianglu; Yun, Hyeong Jin; Liu, Wenyong; Song, Hyung-Jun; Makarov, Nikolay S; Isaienko, Oleksandr; Nakotte, Tom; Chen, Gen; Luo, Hongmei; Klimov, Victor I; Pietryga, Jeffrey M

    2017-05-17

    The use of semiconductor nanocrystal quantum dots (QDs) in optoelectronic devices typically requires postsynthetic chemical surface treatments to enhance electronic coupling between QDs and allow for efficient charge transport in QD films. Despite their importance in solar cells and infrared (IR) light-emitting diodes and photodetectors, advances in these chemical treatments for lead chalcogenide (PbE; E = S, Se, Te) QDs have lagged behind those of, for instance, II-VI semiconductor QDs. Here, we introduce a method for fast and effective ligand exchange for PbE QDs in solution, resulting in QDs completely passivated by a wide range of small anionic ligands. Due to electrostatic stabilization, these QDs are readily dispersible in polar solvents, in which they form highly concentrated solutions that remain stable for months. QDs of all three Pb chalcogenides retain their photoluminescence, allowing for a detailed study of the effect of the surface ionic double layer on electronic passivation of QD surfaces, which we find can be explained using the hard/soft acid-base theory. Importantly, we prepare highly conductive films of PbS, PbSe, and PbTe QDs by directly casting from solution without further chemical treatment, as determined by field-effect transistor measurements. This method allows for precise control over the surface chemistry, and therefore the transport properties of deposited films. It also permits single-step deposition of films of unprecedented thickness via continuous processing techniques, as we demonstrate by preparing a dense, smooth, 5.3-μm-thick PbSe QD film via doctor-blading. As such, it offers important advantages over laborious layer-by-layer methods for solar cells and photodetectors, while opening the door to new possibilities in ionizing-radiation detectors.

  13. Layer thickness measurement using the X-ray fluorescence principle

    International Nuclear Information System (INIS)

    Mengelkamp, B.

    1980-01-01

    Curium 244 having a gamma energy of about 15.5 keV is used as excitation emitter for contactless and continuous measuring of the thickness of metallic layers on iron strip. Soft gamma radiation is absorbed in matter according to the photo effect, so that X-ray fluorescence radiation is generated in the matter, which depends on the element and is radiated to all sides. For instance, it amounts for iron 6.4 keV and is measured with a specific ionisation chamber for this energy range. With increasing atomic number of the elements, the energy of fluorescence radiation increases and hence also the emission signal of the detector. The prerequisite for a usable measuring effect is an element distance of at least two and the thickness of the layer to be measured being in an optimum range. A signal dependent on the thickness of the layer is produced either by absorption of iron radiation (absorption method - aluminium and tin) or by build-up radiation of the material of the layer (emission method - zinc and lead). (orig./GSCH) [de

  14. Influence of internal stress and layer thickness on the formation of hydrogen induced thin film blisters in Mo/Si multilayers

    Science.gov (United States)

    van den Bos, R. A. J. M.; Reinink, J.; Lopaev, D. V.; Lee, C. J.; Benschop, J. P. H.; Bijkerk, F.

    2018-03-01

    A Mo/Si multilayer film may blister under hydrogen exposure. In this paper, we investigate the impact of intrinsic stress on blister formation in multilayers by varying the Si thickness between 3.4–11 nm and changing the hydrogen ion exposure conditions. Increasing the thickness of a-Si is found to introduce a higher average compressive stress in the multilayer film. Measurements of the average film stress before and after hydrogen exposure did not reveal a correlation between stress relaxation and the observation of surface blisters. Comparing the experimentally observed blister size distribution to that predicted by elastic models of blistering due to pressure, and thin film buckling showed that increasing hydrogen pressure under the blister cap is the main cause of the observed blisters. It is also shown that hydrogen diffusion plays an essential role in the blister formation process as sufficient hydrogen is required to pressurize the blister.

  15. Potentiometric RuO2-Ta2O5 pH sensors fabricated using thick film and LTCC technologies.

    Science.gov (United States)

    Manjakkal, Libu; Zaraska, Krzysztof; Cvejin, Katarina; Kulawik, Jan; Szwagierczak, Dorota

    2016-01-15

    The paper reports on the preparation, properties and application of potentiometric pH sensors with thick film RuO2-Ta2O5 sensing electrode and Ag/AgCl/KCl reference electrode screen printed on an alumina substrate. Furthermore, it presents fabrication procedure and characterization of a new miniaturized pH sensor on LTCC (low temperature cofired ceramics) substrate, destined for wireless monitoring. The crystal structure, phase and elemental composition, and microstructure of the films were investigated by X-ray diffractometry, Raman spectroscopy, scanning electron microscopy and energy dispersive spectroscopy. Potentiometric characterization was performed in a wide pH range of 2-12 for different storage conditions and pH loops. The advantages of the proposed thick film pH sensors are: (a) low cost and easy fabrication, (b) excellent sensitivity close to the Nernstian response (56mV/pH) in the wide pH range, (c) fast response, (d) long lifetime, (e) good reproducibility, (f) low hysteresis and drift effects, and (g) low cross-sensitivity towards Li(+), Na(+) and K(+) as interfering ions. The applicability of the sensors for pH measurement of river, tap and distilled water, and some drinks was also tested. Copyright © 2015 Elsevier B.V. All rights reserved.

  16. DNA Measurement of Overlapping Cell Nuclei in Thick Tissue Sections

    Directory of Open Access Journals (Sweden)

    Liang Ji

    1997-01-01

    Full Text Available The paper describes an improved image analysis procedure for measuring the DNA content of cell nuclei in thick sections of liver tissue by absorption densitometry. Whereas previous methods only permitted the analysis of isolated nuclei, the new technique enables both isolated and overlapping nuclei to be measured. A 3D segmentation procedure determines whether each object is an isolated nucleus or a pair of overlapping nuclei; in the latter case the combined optical density is redistributed to the individual nuclei. A selection procedure ensures that only complete nuclei are measured.

  17. MEASUREMENT OF RNFL THICKNESS USING OCT IMAGES FOR GLAUCOMA DETECTION

    Directory of Open Access Journals (Sweden)

    Dhivyabharathi

    2013-08-01

    Full Text Available The thickness of retinal nerve fiber layer (RNFL is one of the pompous parameters for assessing the disease, Glaucoma. A substantial amount of vision can be lost before the patient becomes aware of any defect. Optical Coherence Tomography (OCT provides enhanced depth and clarity of viewing tissues with high resolution compared with other medical imaging devices. It examines the living tissue non-invasively. This paper presents an automatic method to find the thickness of RNFL using OCT images. The proposed algorithm first extracts all the layers present in the OCT image by texture segmentation using Gabor filter method and an algorithm is then developed to segment the RNFL. The thickness measurement of RNFL is automatically displayed based on pixel calculation. The calculated thickness values are compared with the original values obtained from hospital. The result shows that the proposed algorithm is efficient in segmenting the region of interest without manual intervention. The effectiveness of the proposed method is proved statistically by the performance analysis.

  18. Pelvic floor muscle thickness measured by perineal ultrasonography

    DEFF Research Database (Denmark)

    Bernstein, Inge Thomsen; Juul, N; Grønvall, S

    1991-01-01

    and at contraction was 9.4 +/- 0.8 mm and 11.5 +/- 1.1 mm respectively (mean +/- SD). Contraction increased the thickness by 2.2 +/- 0.8 mm or 23 +/- 8%. The intra- and inter observer standard deviation of the estimate was in the range of 4-6%. In conclusion, we find the reliability of the measurements acceptable....

  19. Ab initio analytical model of light transmission through a cylindrical subwavelength hole in an optically thick film

    DEFF Research Database (Denmark)

    Bordo, Vladimir

    2011-01-01

    the film thickness considerably exceeds the hole diameter. It is emphasized that a specific pole corresponding to excitation of surface plasmon polaritons does not appear in the analysis. The theory is illustrated by the calculation of light transmission through a subwavelength hole in an Ag film.......The rigorous analytical theory of light transmission through a cylindrical hole of arbitrary diameter in an optically thick film is developed. The approach is based on the introduction of fictitious surface currents at both hole openings and both film surfaces. The solution of Maxwell’s equations...

  20. Highly accurate thickness measurement of multi-layered automotive paints using terahertz technology

    Science.gov (United States)

    Krimi, Soufiene; Klier, Jens; Jonuscheit, Joachim; von Freymann, Georg; Urbansky, Ralph; Beigang, René

    2016-07-01

    In this contribution, we present a highly accurate approach for thickness measurements of multi-layered automotive paints using terahertz time domain spectroscopy in reflection geometry. The proposed method combines the benefits of a model-based material parameters extraction method to calibrate the paint coatings, a generalized Rouard's method to simulate the terahertz radiation behavior within arbitrary thin films, and the robustness of a powerful evolutionary optimization algorithm to increase the sensitivity of the minimum thickness measurement limit. Within the framework of this work, a self-calibration model is introduced, which takes into consideration the real industrial challenges such as the effect of wet-on-wet spray in the painting process.

  1. Highly accurate thickness measurement of multi-layered automotive paints using terahertz technology

    International Nuclear Information System (INIS)

    Krimi, Soufiene; Beigang, René; Klier, Jens; Jonuscheit, Joachim; Freymann, Georg von; Urbansky, Ralph

    2016-01-01

    In this contribution, we present a highly accurate approach for thickness measurements of multi-layered automotive paints using terahertz time domain spectroscopy in reflection geometry. The proposed method combines the benefits of a model-based material parameters extraction method to calibrate the paint coatings, a generalized Rouard's method to simulate the terahertz radiation behavior within arbitrary thin films, and the robustness of a powerful evolutionary optimization algorithm to increase the sensitivity of the minimum thickness measurement limit. Within the framework of this work, a self-calibration model is introduced, which takes into consideration the real industrial challenges such as the effect of wet-on-wet spray in the painting process.

  2. Structural, magnetic and microwave properties of barium hexaferrite thick films with different Fe/Ba mole ratio

    Energy Technology Data Exchange (ETDEWEB)

    Verma, Samiksha [School of Physics and Materials Science, Thapar University, Patiala 147004 (India); Dhawan, S.K. [Polymeric & Soft Materials Section, National Physical laboratory, New Delhi 119912 (India); Paesano, Andrea [Departamento de Fisica, Universidade Estadual de Maringá, Av. Colombo 5790, Maringá (Brazil); Pandey, O.P. [School of Physics and Materials Science, Thapar University, Patiala 147004 (India); Sharma, Puneet, E-mail: puneet.sharma@thapar.edu [School of Physics and Materials Science, Thapar University, Patiala 147004 (India)

    2015-12-15

    Barium hexaferrite (BaFe{sub 12}O{sub 19}) thick films (∼60 µm) with different BaO·xFe{sub 2}O{sub 3} mole ratio (x=5.0–6.0) were prepared by screen printing method. X-ray diffraction analysis confirmed the formation of single phase BaFe{sub 12}O{sub 19} (BaM). Preferential site occupation of Fe{sup 3+} ion at five different crystallographic sites, with varied mole ratio was measured by Mössbauer spectroscopy. Vacancy fraction found to be higher at 4f{sub 1}, 4f{sub 2} and 2b sites for mole ratio 5.5 and 5.0 respectively. Magnetic measurement shows that the magnetization (M) and magnetocrystalline anisotropy field (H{sub a}) depends upon mole ratio. M and H{sub a} are found to be maximum for mole ratio 5.5, while the coercivity (H{sub c}) remains constant. Reflection losses (R{sub L}) in the frequency range of 12–18 GHz were also studied. Present investigation demonstrates the effect of mole ratio on structural, magnetic and microwave absorption properties of BaM thick films for microwave device applications. - Highlights: • Single phase BaM thick films with different Fe/Ba mole ratio are prepared. • Site preference of Fe ion is estimated by Mössbauer spectroscopy. • Magnetization and magnetocrystalline ansisotropy is found maximum for 5.5 mole ratio. • Absorption frequency found to vary with the mole ratio.

  3. Ferrimagnetic Tb-Fe Alloy Thin Films: Composition and Thickness Dependence of Magnetic Properties and All-Optical Switching

    Directory of Open Access Journals (Sweden)

    Birgit eHebler

    2016-02-01

    Full Text Available Ferrimagnetic rare earth - transition metal Tb-Fe alloy thin films exhibit a variety of different magnetic properties, which depends strongly on composition and temperature. In this study, first the influence of the film thickness (5 - 85 nm on the sample magnetic properties was investigated in a wide composition range between 15 at.% and 38 at.% of Tb. From our results, we find that the compensation point, remanent magnetization, and magnetic anisotropy of the Tb-Fe films depend not only on the composition but also on the thickness of the magnetic film up to a critical thickness of about 20-30 nm. Beyond this critical thickness, only slight changes in magnetic properties are observed. This behavior can be attributed to a growth-induced modification of the microstructure of the amorphous films, which affects the short range order. As a result, a more collinear alignment of the distributed magnetic moments of Tb along the out-of-plane direction with film thickness is obtained. This increasing contribution of the Tb sublattice magnetization to the total sample magnetization is equivalent to a sample becoming richer in Tb and can be referred to as an effective composition. Furthermore, the possibility of all-optical switching, where the magnetization orientation of Tb-Fe can be reversed solely by circularly polarized laser pulses, was analyzed for a broad range of compositions and film thicknesses and correlated to the underlying magnetic properties.

  4. Structural, optical and ac electrical characterization of CBD synthesized NiO thin films: Influence of thickness

    Science.gov (United States)

    Das, M. R.; Mukherjee, A.; Mitra, P.

    2017-09-01

    We have studied the electrical conductivity, dielectric relaxation mechanism and impedance spectroscopy characteristics of nickel oxide (NiO) thin films synthesized by chemical bath deposition (CBD) method. Thickness dependent structural, optical and ac electrical characterization has been carried out and deposition time was varied to control the thickness. The material has been characterized using X-ray diffraction and UV-VIS spectrophotometer. Impedance spectroscopy analysis confirmed enhancement of ac conductivity and dielectric constant for films deposited with higher deposition time. Decrease of grain size in thicker films were confirmed from XRD analysis and activation energy of the material for electrical charge hopping process was increased with thickness of the film. Decrease in band gap in thicker films were observed which could be associated with creation of additional energy levels in the band gap of the material. Cole-Cole plot shows contribution of both grain and grain boundary towards total resistance and capacitance. The overall resistance was found to decrease from 14.6 × 105 Ω for 30 min deposited film ( 120 nm thick) to 2.42 × 105 Ω for 120 min deposited film ( 307 nm thick). Activation energy value to electrical conduction process evaluated from conductivity data was found to decrease with thickness. Identical result was obtained from relaxation time approach suggesting hopping mechanism of charge carriers.

  5. Thickness-dependent dispersion parameters, energy gap and nonlinear refractive index of ZnSe thin films

    Energy Technology Data Exchange (ETDEWEB)

    Prakash, Deo [School of Computer Science & Engineering, Faculty of Engineering, SMVD University, Kakryal, Katra 182320, J& K (India); Shaaban, E.R., E-mail: esam_ramadan2008@yahoo.com [Physics Department, Faculty of Science, Al-Azhar University, Assiut 71542 (Egypt); Shapaan, M. [Department of Physics, Faculty of Science, Al-Azahar University, Cairo (Egypt); Mohamed, S.H. [Physics Department, Faculty of Science, Sohag University, 82524 Sohag (Egypt); Othman, A.A. [Physics Department, Faculty of Science, Assiut University, Assiut 71516 (Egypt); Verma, K.D., E-mail: kdverma1215868@gmail.com [Material Science Research Laboratory, Department of Physics, S. V. College, Aligarh 202001, U.P. (India)

    2016-08-15

    Highlights: • Combined experimental and theoretical researches on ZnSe Thin Films. • The film thickness and refractive index were determined using envelope method. • The absorption coefficient and the energy gap were calculated. • Dispersion parameters were determined using Wemple-DiDomenico relation. • The third order susceptibility and nonlinear refractive index were calculated. - Abstract: Zinc selenide (ZnSe) thin films with different thicknesses were evaporated onto glass substrates using the thermal evaporation technique. X-ray diffraction analysis confirmed that both the film and powder have cubic zinc-blende structure. The fundamental optical parameters like absorption coefficient, extinction coefficient and band gap were evaluated in transparent region of transmittance and reflectance spectrum. The optical transition of the films was found to be allowed, where the energy gap increased from 2.576 to 2.702 eV with increasing film thickness. Also, the refractive index value increase with increasing film thickness. The refractive indices evaluated through envelope method were extrapolated by Cauchy dispersion relationship over the whole spectra range. Additionally, the dispersion of refractive index was determined in terms of Wemple-DiDomenico single oscillator model. Third order susceptibility and nonlinear refractive index were determined for different thickness of ZnSe thin films.

  6. Thickness dependence of the electronic properties in V2O3 thin films

    Science.gov (United States)

    Grygiel, C.; Simon, Ch.; Mercey, B.; Prellier, W.; Frésard, R.; Limelette, P.

    2007-12-01

    High quality vanadium sesquioxide V2O3 films (170-1100Å) were grown using the pulsed laser deposition technique on (0001)-oriented sapphire substrates, and the effects of film thickness on the lattice strain and electronic properties were examined. X-ray diffraction indicates that there is an in-plane compressive lattice parameter (a), close to -3.5% with respect to the substrate and an out-of-plane tensile lattice parameter (c). The thin film samples display metallic character between 2 and 300K, and no metal-to-insulator transition is observed. At low temperature, the V2O3 films behave as a strongly correlated metal, and the resistivity (ρ) follows the equation ρ =ρ0+AT2, where A is the transport coefficient in a Fermi liquid. Typical values of A have been calculated to be 0.14μΩcmK-2, which is in agreement with the coefficient reported for V2O3 single crystals under high pressure. Moreover, a strong temperature dependence of the Hall resistance confirms the electronic correlations of these V2O3 thin film samples.

  7. Processing parameters for ZnO-based thick film varistors obtained by screen printing

    Directory of Open Access Journals (Sweden)

    de la Rubia, M. A.

    2006-06-01

    Full Text Available Thick film varistors based on the ZnO-Bi2O3-Sb2O3 system have been prepared by screen printing on dense alumina substrates. Different processing parameters like the paste viscosity, burn out and sintering cycles, green and sintered thickness, have been studied to improve the processing of ZnO-based thick film varistors. Starting powders were pre-treated in two different ways in order to control both the Bi-rich liquid phase formation and the excessive volatilization of Bi2O3 during sintering due to the high area/volume ratio of the thick films. Significant changes have been observed in the electrical properties related to the different firing schedule and selection of the starting powders.

    Se han preparado varistores basados en el sistema ZnO-Bi2O3-Sb2O3 en forma de lámina gruesa sobre sustratos de alúmina densa. Diferentes parámetros del procesamiento como la viscosidad de la pasta, los ciclos de calcinación y sinterización y el espesor en verde y sinterizado han sido estudiados para mejorar el procesamiento de los varistores basados en ZnO preparados en forma de lámina gruesa. Los polvos de partida fueron pretratados de dos formas diferentes con el objetivo de controlar la formación de la fase líquida rica en bismuto y la excesiva volatilización de Bi2O3 durante la sinterización debida a la alta relación área-volumen de las láminas gruesas. Se han observado cambios significativos en las propiedades eléctricas relacionadas con los diferentes ciclos de calcinado y con la selección de los polvos de partida.

  8. Thermal expansion coefficient measurement from electron diffraction of amorphous films in a TEM.

    Science.gov (United States)

    Hayashida, Misa; Cui, Kai; Malac, Marek; Egerton, Ray

    2018-05-01

    We measured the linear thermal expansion coefficients of amorphous 5-30 nm thick SiN and 17 nm thick Formvar/Carbon (F/C) films using electron diffraction in a transmission electron microscope. Positive thermal expansion coefficient (TEC) was observed in SiN but negative coefficients in the F/C films. In case of amorphous carbon (aC) films, we could not measure TEC because the diffraction radii required several hours to stabilize at a fixed temperature. Crown Copyright © 2018. Published by Elsevier B.V. All rights reserved.

  9. Role of geometric parameters in electrical measurements of insulating thin films deposited on a conductive substrate

    Science.gov (United States)

    Kumar, S.; Gerhardt, R. A.

    2012-03-01

    The effects of film thickness, electrode size and substrate thickness on the impedance parameters of alternating frequency dielectric measurements of insulating thin films deposited on conductive substrates were studied through parametric finite-element simulations. The quasi-static forms of Maxwell's electromagnetic equations in a time harmonic mode were solved using COMSOL Multiphysics® for several types of 2D models (linear and axisymmetric). The full 2D model deals with a configuration in which the impedance is measured between two surface electrodes on top of a film deposited on a conductive substrate. For the simplified 2D models, the conductive substrate is ignored and the two electrodes are placed on the top and bottom of the film. By comparing the full model and the simplified models, approximations and generalizations are deduced. For highly insulating films, such as the case of insulating SiO2 films on a conducting Si substrate, even the simplified models predict accurate capacitance values at all frequencies. However, the edge effects on the capacitance are found to be significant when the film thickness increases and/or the top electrode contact size decreases. The thickness of the substrate affects predominantly the resistive components of the dielectric response while having no significant effect on the capacitive components. Changing the electrode contact size or the film thickness determines the specific values of the measured resistance or capacitance while the material time constant remains the same, and thus this affects the frequency dependence that is able to be detected. This work highlights the importance of keeping in mind the film thickness and electrode contact size for the correct interpretation of the measured dielectric properties of micro/nanoscale structures that are often investigated using nanoscale capacitance measurements.

  10. Ultrasound-based measurement of liquid-layer thickness: A novel time-domain approach

    Science.gov (United States)

    Praher, Bernhard; Steinbichler, Georg

    2017-01-01

    Measuring the thickness of a thin liquid layer between two solid materials is important when the adequate separation of metallic parts by a lubricant film (e.g., in bearings or mechanical seals) is to be assessed. The challenge in using ultrasound-based systems for such measurements is that the signal from the liquid layer is a superposition of multiple reflections. We have developed an algorithm for reconstructing this superimposed signal in the time domain. By comparing simulated and measured signals, the time-of-flight of the ultrasonic pulse in a layer can be estimated. With the longitudinal sound velocity known, the layer thickness can then be calculated. In laboratory measurements, we validate successfully (maximum relative error 4.9%) our algorithm for layer thicknesses ranging from 30 μm to 200 μm. Furthermore, we tested our method in the high-temperature environment of polymer processing by measuring the clearance between screw and barrel in the plasticisation unit of an injection moulding machine. The results of such measurements can indicate (i) the wear status of the tribo-mechanical screw-barrel system and (ii) unsuitable process conditions.

  11. Noncontact optical measurement of lens capsule thickness ex vivo

    Science.gov (United States)

    Ziebarth, Noel M.; Manns, Fabrice; Uhlhorn, Stephen; Parel, Jean-Marie

    2004-07-01

    Purpose: To design a non-contact optical system to measure lens capsule thickness in cadaver eyes. Methods: The optical system uses a 670nm laser beam delivered to a single-mode fiber coupler. The output of the fiber coupler is focused onto the tissue using an aspheric lens (NA=0.68) mounted on a motorized translation stage. Light reflected from the sample is collected by the fiber coupler and sent to a silicon photodiode connected to a power meter. Peaks in the power signal are detected when the focal point of the aspheric lens coincides with the capsule boundaries. The capsule thickness is proportional to the distance between successive peaks. Anterior and posterior lens capsule thickness measurements were performed on 13 human, 10 monkey, and 34 New Zealand white rabbit lenses. The cadaver eyes were prepared for optical measurements by bonding a PMMA ring on the sclera. The posterior pole was sectioned, excess vitreous was removed, and the eye was placed on a Teflon slide. The cornea and iris were then sectioned. After the experiments, the lenses were excised, placed in 10% buffered formalin, and prepared for histology. Results: Central anterior lens capsule thickness was 9.4+/-2.9μm (human), 11.2+/-6.6μm (monkey), and 10.3+/-3.6μm (rabbit) optically and 14.9+/-1.6μm (human), 17.7+/-4.9μm (monkey), and 12.6+/-2.3μm (rabbit) histologically. The values for the central posterior capsule were 9.4+/-2.9μm (human), 6.6+/-2.5μm (monkey), and 7.9+/-2.3μm (rabbit) optically and 4.6+/-1.4μm (human), 4.5+/-1.2μm (monkey), and 5.7+/-1.7μm (rabbit) histologically. Conclusions: This study demonstrates that a non-contact optical system can successfully measure lens capsule thickness in cadaver eyes.

  12. Measurement of through-thickness thermal diffusivity of thermoplastics using thermal wave method

    Science.gov (United States)

    Singh, R.; Mellinger, A.

    2015-04-01

    Thermo-physical properties, such as thermal conductivity, thermal diffusivity and specific heat are important quantities that are needed to interpret and characterize thermoplastic materials. Such characterization is necessary for many applications, ranging from aerospace engineering to food packaging, electrical and electronic industry and medical science. In this work, the thermal diffusivity of commercially available polymeric films is measured in the thickness direction at room temperature using thermal wave method. The results obtained with this method are in good agreement with theoretical and experimental values.

  13. High-Tc Superconducting Thick-Film Spiral Magnet: Development and Characterization of a Single Spiral Module

    National Research Council Canada - National Science Library

    McGinnis, W

    1997-01-01

    The objective of this project was to make characterized and numerically model prototype modules of a new type of superconducting electromagnet based on stacked spirals of superconducting thick films...

  14. The roles of buffer layer thickness on the properties of the ZnO epitaxial films

    Energy Technology Data Exchange (ETDEWEB)

    Tang, Kun, E-mail: ktang@nju.edu.cn [Nanjing National Laboratory of Microstructures and School of Electronic Science and Engineering, Nanjing University, Nanjing 210023 (China); Huang, Shimin [Nanjing National Laboratory of Microstructures and School of Electronic Science and Engineering, Nanjing University, Nanjing 210023 (China); Gu, Shulin, E-mail: slgu@nju.edu.cn [Nanjing National Laboratory of Microstructures and School of Electronic Science and Engineering, Nanjing University, Nanjing 210023 (China); Zhu, Shunming [Nanjing National Laboratory of Microstructures and School of Electronic Science and Engineering, Nanjing University, Nanjing 210023 (China); Ye, Jiandong [Nanjing National Laboratory of Microstructures and School of Electronic Science and Engineering, Nanjing University, Nanjing 210023 (China); Nanjing University Institute of Optoelectronics at Yangzhou, Yangzhou 225009 (China); Xu, Zhonghua; Zheng, Youdou [Nanjing National Laboratory of Microstructures and School of Electronic Science and Engineering, Nanjing University, Nanjing 210023 (China)

    2016-12-01

    Highlights: • The growth mechanism has been revealed for the ZnO buffers with different thickness. • The surface morphology has been determined as the key factor to affect the epitaxial growth. • The relation between the hexagonal pits from buffers and epi-films has been established. • The hexagonal pits formed in the epi-films have been attributed to the V-shaped defects inheriting from the dislocations in the buffers. • The structural and electrical properties of the V-defects have been presented and analyzed. - Abstract: In this article, the authors have investigated the optimization of the buffer thickness for obtaining high-quality ZnO epi-films on sapphire substrates. The growth mechanism of the buffers with different thickness has been clearly revealed, including the initial nucleation and vertical growth, the subsequent lateral growth with small grain coalescence, and the final vertical growth along the existing larger grains. Overall, the quality of the buffer improves with increasing thickness except the deformed surface morphology. However, by a full-scale evaluation of the properties for the epi-layers, the quality of the epi-film is briefly determined by the surface morphology of the buffer, rather than the structural, optical, or electrical properties of it. The best quality epi-layer has been grown on the buffer with a smooth surface and well-coalescent grains. Meanwhile, due to the huge lattice mismatch between sapphire and ZnO, dislocations are inevitably formed during the growth of buffers. More importantly, as the film grows thicker, the dislocations may attracting other smaller dislocations and defects to reduce the total line energy and thus result in the formation of V-shape defects, which are connected with the bottom of the threading dislocations in the buffers. The V-defects appear as deep and large hexagonal pits from top view and they may act as electron traps which would affect the free carrier concentration of the epi-layers.

  15. The roles of buffer layer thickness on the properties of the ZnO epitaxial films

    International Nuclear Information System (INIS)

    Tang, Kun; Huang, Shimin; Gu, Shulin; Zhu, Shunming; Ye, Jiandong; Xu, Zhonghua; Zheng, Youdou

    2016-01-01

    Highlights: • The growth mechanism has been revealed for the ZnO buffers with different thickness. • The surface morphology has been determined as the key factor to affect the epitaxial growth. • The relation between the hexagonal pits from buffers and epi-films has been established. • The hexagonal pits formed in the epi-films have been attributed to the V-shaped defects inheriting from the dislocations in the buffers. • The structural and electrical properties of the V-defects have been presented and analyzed. - Abstract: In this article, the authors have investigated the optimization of the buffer thickness for obtaining high-quality ZnO epi-films on sapphire substrates. The growth mechanism of the buffers with different thickness has been clearly revealed, including the initial nucleation and vertical growth, the subsequent lateral growth with small grain coalescence, and the final vertical growth along the existing larger grains. Overall, the quality of the buffer improves with increasing thickness except the deformed surface morphology. However, by a full-scale evaluation of the properties for the epi-layers, the quality of the epi-film is briefly determined by the surface morphology of the buffer, rather than the structural, optical, or electrical properties of it. The best quality epi-layer has been grown on the buffer with a smooth surface and well-coalescent grains. Meanwhile, due to the huge lattice mismatch between sapphire and ZnO, dislocations are inevitably formed during the growth of buffers. More importantly, as the film grows thicker, the dislocations may attracting other smaller dislocations and defects to reduce the total line energy and thus result in the formation of V-shape defects, which are connected with the bottom of the threading dislocations in the buffers. The V-defects appear as deep and large hexagonal pits from top view and they may act as electron traps which would affect the free carrier concentration of the epi-layers.

  16. Thickness oscillations of the transport properties in n-type Bi{sub 2}Te{sub 3} topological insulator thin films

    Energy Technology Data Exchange (ETDEWEB)

    Rogacheva, E.I., E-mail: rogacheva@kpi.kharkov.ua [National Technical University “Kharkov Polytechnic Institute”, 21 Frunze Street, Kharkov 61002 (Ukraine); Budnik, A.V.; Sipatov, A.Yu.; Nashchekina, O.N. [National Technical University “Kharkov Polytechnic Institute”, 21 Frunze Street, Kharkov 61002 (Ukraine); Fedorov, A.G. [Institute for Single Crystals of NAS of Ukraine, 60 Lenin Prospect, Kharkov 61001 (Ukraine); Dresselhaus, M.S.; Tang, S. [Department of Electrical Engineering and Computer Science and Department of Physics, Massachusetts Institute of Technology, 77 Massachusetts Ave., Cambridge, MA 02139 (United States)

    2015-11-02

    The dependences of the electrical conductivity, Seebeck coefficient and Hall coefficient on the thickness (d = 20–155 nm) of the n-type thin films grown on the glass substrates by the thermal evaporation in vacuum of the n-type Bi{sub 2}Te{sub 3} topological insulator crystals have been measured. It has been established that these dependences have an oscillatory character with a substantial amplitude. The obtained results are interpreted in terms of quantum size effects, taking into account the peculiar properties of the surface layers of the Bi{sub 2}Te{sub 3} films connected with the topological insulator nature of the bismuth telluride. - Highlights: • The thickness dependences of Bi{sub 2}Te{sub 3} thin films kinetic coefficients were obtained. • The dependences have oscillatory character with a substantial undamped amplitude. • The oscillation period increases with decreasing film thickness. • The oscillations are attributed to electron confinement in the film growth direction. • It is suggested that topological surface layer affects quantum processes in films.

  17. Enhanced heat transfer is dependent on thickness of graphene films: the heat dissipation during boiling

    Science.gov (United States)

    Ahn, Ho Seon; Kim, Jin Man; Kim, TaeJoo; Park, Su Cheong; Kim, Ji Min; Park, Youngjae; Yu, Dong In; Hwang, Kyoung Won; Jo, HangJin; Park, Hyun Sun; Kim, Hyungdae; Kim, Moo Hwan

    2014-01-01

    Boiling heat transfer (BHT) is a particularly efficient heat transport method because of the latent heat associated with the process. However, the efficiency of BHT decreases significantly with increasing wall temperature when the critical heat flux (CHF) is reached. Graphene has received much recent research attention for applications in thermal engineering due to its large thermal conductivity. In this study, graphene films of various thicknesses were deposited on a heated surface, and enhancements of BHT and CHF were investigated via pool-boiling experiments. In contrast to the well-known surface effects, including improved wettability and liquid spreading due to micron- and nanometer-scale structures, nanometer-scale folded edges of graphene films provided a clue of BHT improvement and only the thermal conductivity of the graphene layer could explain the dependence of the CHF on the thickness. The large thermal conductivity of the graphene films inhibited the formation of hot spots, thereby increasing the CHF. Finally, the provided empirical model could be suitable for prediction of CHF. PMID:25182076

  18. Effects of surface roughness and film thickness on the adhesion of a bioinspired nanofilm

    Science.gov (United States)

    Peng, Z. L.; Chen, S. H.

    2011-05-01

    Inspired by the gecko's climbing ability, adhesion between an elastic nanofilm with finite length and a rough substrate with sinusoidal roughness is studied in the present paper, considering the effects of substrate roughness and film thickness. It demonstrates that the normal adhesion force of the nanofilm on a rough substrate depends significantly on the geometrical parameters of the substrate. When the film length is larger than the wavelength of the sinusoidal roughness of the substrate, the normal adhesion force decreases with increasing surface roughness, while the normal adhesion force initially decreases then increases if the wavelength of roughness is larger than the film length. This finding is qualitatively consistent with a previously interesting experimental observation in which the adhesion force of the gecko spatula is found to reduce significantly at an intermediate roughness. Furthermore, it is inferred that the gecko may achieve an optimal spatula thickness not only to follow rough surfaces, but also to saturate the adhesion force. The results in this paper may be helpful for understanding how geckos overcome the influence of natural surface roughness and possess such adhesion to support their weights.

  19. Polar orientation of a pendant anionic chromophore in thick layer-by-layer self-assembled polymeric films

    OpenAIRE

    Garg, Akhilesh; Davis, Richey M.; Durak, Cemil; Heflin, James R.; Gibson, Harry W.

    2008-01-01

    Multilayer films with up to 600 bilayers and 740 nm thickness were fabricated using the alternating deposition of poly(allylamine hydrochloride) and poly{1-[p-(3'-carboxy-4'-hydroxyphenylazo)benzenesulfonamido]-1,2-ethand iyl} on glass substrates. Linear relationships for absorbance, thickness, and the square root of the second harmonic intensity versus the number of bilayers demonstrates that the films have long range polar order and optical homogeneity. The deposition conditions (i.e., pH o...

  20. Effects of mechanical properties of polymer on ceramic-polymer composite thick films fabricated by aerosol deposition

    OpenAIRE

    Kwon, Oh-Yun; Na, Hyun-Jun; Kim, Hyung-Jun; Lee, Dong-Won; Nam, Song-Min

    2012-01-01

    Two types of ceramic-polymer composite thick films were deposited on Cu substrates by an aerosol deposition process, and their properties were investigated to fabricate optimized ceramic-based polymer composite thick films for application onto integrated substrates with the advantage of plasticity. When polymers with different mechanical properties, such as polyimide (PI) and poly(methyl methacrylate) (PMMA), are used as starting powders together with α-Al2O3 powder, two types of composite fi...

  1. Planar structured perovskite solar cells by hybrid physical chemical vapor deposition with optimized perovskite film thickness

    Science.gov (United States)

    Wei, Xiangyang; Peng, Yanke; Jing, Gaoshan; Cui, Tianhong

    2018-05-01

    The thickness of perovskite absorber layer is a critical parameter to determine a planar structured perovskite solar cell’s performance. By modifying the spin coating speed and PbI2/N,N-dimethylformamide (DMF) solution concentration, the thickness of perovskite absorber layer was optimized to obtain high-performance solar cells. Using a PbI2/DMF solution of 1.3 mol/L, maximum power conversion efficiency (PCE) of a perovskite solar cell is 15.5% with a perovskite film of 413 nm at 5000 rpm, and PCE of 14.3% was also obtained for a solar cell with a perovskite film of 182 nm thick. It is derived that higher concentration of PbI2/DMF will result in better perovskite solar cells. Additionally, these perovskite solar cells are highly uniform. In 14 sets of solar cells, standard deviations of 11 sets of solar cells were less than 0.50% and the smallest standard deviation was 0.25%, which demonstrates the reliability and effectiveness of hybrid physical chemical vapor deposition (HPCVD) method.

  2. Thickness dependence of the electrical and thermoelectric properties of co-evaporated Sb2Te3 films

    Science.gov (United States)

    Shen, Haishan; Lee, Suhyeon; Kang, Jun-gu; Eom, Tae-Yil; Lee, Hoojeong; Han, Seungwoo

    2018-01-01

    P-type antimony telluride (Sb2Te3) films of various thicknesses (1-, 6-, 10-, and 16-μm) were deposited on an oxidized Si (100) substrate at 250 °C by effusion cell co-evaporation. Microstructural analysis using X-ray diffraction, scanning electron microscopy, and transmission electron microscopy revealed that the grains of the films grew in a mode in which recrystallization was prevalent and grain growth subdued, in contrast to typical film growth, which is often characterized by grain growth. The resultant microstructure exhibited narrow columnar grains, the preferred orientation of which changed with film growth thickness from (1010) with the 1-μm films to (015) for the 6- and 10-μm films, and finally (110) for the 16-μm films. Carrier mobility and the overall thermoelectric properties of the Sb2Te3 films were affected significantly by changes in the film microstructure; this was attributed to the strong anisotropy of Sb2Te3 regarding electrical conductivity. The highest power factor of 3.3 mW/mK2 was observed for the 1-μm-thick Sb2Te3 film.

  3. Measurement of the thickness of the bronchial epithelium

    International Nuclear Information System (INIS)

    Bowden, D.H.; Baldwin, F.

    1989-02-01

    Cancer of the lung in uranium miners is thought to be related to the inhalation of gaseous radon daughters which become attached to molecules of water vapour or to dust particles. Since, the depth of tissue penetration by alpha particles is short, the thickness of the epithelium that lines the bronchial tree may be a critical factor in the development of cancers at specific sites in the lung. The objectives of the present study were: 1) to measure the thickness of human bronchial epithelium; 2) to determine the distribution and depth of the nuclei of basal cells in the bronchial epithelium; and 3) to compare these parameters in groups of smokers and non-smokers. Twenty-nine surgically removed specimens of the lung were examined (26 smokers, 3 non-smokers). The specimens were fixed and prepared for examination by light and electron microscopy. Blocks of tissue were oriented so that the maximum number of bronchi were cut in cross-section; measurements included bronchi of all sizes from bronchial generations (1≥ 9.01 mm) diameter to the smallest bronchioles, generations 7 - 16 (0.26 - 2.0 mm). Comparison of measurements in smokers and non-smokers show no significant differences, so that the 29 cases are considered to represent a homogeneous group. With progressive divisions of the bronchi, the epithelium decreases in thickness. Of more importance are the figures relating to the distance from the cell surface to the underlying nucleus. Here too, with the exception of goblet cells, the measurements are significantly smaller in generations 7 - 16 than in generation 1

  4. Evolution of damping in ferromagnetic/nonmagnetic thin film bilayers as a function of nonmagnetic layer thickness

    Science.gov (United States)

    Azzawi, S.; Ganguly, A.; Tokaç, M.; Rowan-Robinson, R. M.; Sinha, J.; Hindmarch, A. T.; Barman, A.; Atkinson, D.

    2016-02-01

    The evolution of damping in Co/Pt, Co/Au, and Ni81Fe19 /Pt bilayers was studied with increasing nonmagnetic (NM) heavy-metal layer thicknesses in the range 0.2 nm ≤tNM≤10 nm , where tNM is the NM layer thickness. Magnetization precession was measured in the time domain using time-resolved magneto-optical Kerr effect magnetometry. Fitting of the data with a damped sinusoidal function was undertaken in order to extract the phenomenological Gilbert damping coefficient α . For Pt-capped Co and Ni81Fe19 layers a large and complex dependence of α on the Pt layer thickness was observed, while for Au capping no significant dependence was observed. It is suggested that this difference is related to the different localized spin-orbit interaction related to intermixing and to d -d hybridization of Pt and Au at the interface with Co or Ni81Fe19 . Also it was shown that damping is affected by the crystal structure differences in FM thin films and at the interface, which can modify the spin-diffusion length and the effective spin-mixing conductance. In addition to the intrinsic damping an extrinsic contribution plays an important role in the enhancement of damping when the Pt capping layer is discontinuous. The dependence of damping on the nonmagnetic layer thickness is complex but shows qualitative agreement with recent theoretical predictions.

  5. Structural, magnetic and microwave properties of barium hexaferrite thick films with different Fe/Ba mole ratio

    Science.gov (United States)

    Verma, Samiksha; Dhawan, S. K.; Paesano, Andrea; Pandey, O. P.; Sharma, Puneet

    2015-12-01

    Barium hexaferrite (BaFe12O19) thick films (∼60 μm) with different BaO·xFe2O3 mole ratio (x=5.0-6.0) were prepared by screen printing method. X-ray diffraction analysis confirmed the formation of single phase BaFe12O19 (BaM). Preferential site occupation of Fe3+ ion at five different crystallographic sites, with varied mole ratio was measured by Mössbauer spectroscopy. Vacancy fraction found to be higher at 4f1, 4f2 and 2b sites for mole ratio 5.5 and 5.0 respectively. Magnetic measurement shows that the magnetization (M) and magnetocrystalline anisotropy field (Ha) depends upon mole ratio. M and Ha are found to be maximum for mole ratio 5.5, while the coercivity (Hc) remains constant. Reflection losses (RL) in the frequency range of 12-18 GHz were also studied. Present investigation demonstrates the effect of mole ratio on structural, magnetic and microwave absorption properties of BaM thick films for microwave device applications.

  6. Effect of anionic dopants on thickness, morphology and electrical properties of polypyrrole ultra-thin films prepared by in situ chemical polymerization

    International Nuclear Information System (INIS)

    Mahmoodian, Mehrnoosh; Pourabbas, Behzad; Mohajerzadeh, Shams

    2015-01-01

    The effect of different dopant anions on deposition and characteristics of polypyrrole (PPy) thin film has been studied in this work. Ultra-thin films of conducting PPy were deposited on insulating surfaces of glass and oxidized silicon wafer by in situ chemical polymerization in the presence of different anionic dopants including sodium dodecylbenzenesulfonate, sodium dodecyl sulfate, α-naphthalene sulfonic acid, anthraquinone-2-sulfonic acid sodium salt monohydrate/5-sulfosalicylic acid dehydrate, and camphor sulfonic acid. Hydrophilic/hydrophobic properties and morphology of the self-assembled monolayer of N-(3-trimethoxysilylpropyl)pyrrole, the surface modifying agent in this work, and PPy thin films were characterized before and after deposition by contact angle measurements, field emission scanning electron microscopy, and atomic force microscopy. Chemical structure, thickness, and conductivity of the thin films were also studied by attenuated total reflectance Fourier transform infrared spectrometer, ellipsometry, and four-point probe measurements. The results showed deposition of thin films of conducting PPy with comparable thickness in the range of 6-31 nm and different morphologies, uniformity, and smoothness with average roughness in the range of 0.3-6 nm and relatively high range of conductivity on the modified surfaces. - Highlights: • Conducting thin films of polypyrrole were deposited on glass and SiO 2 substrates. • Surface modification using pyrrole-silane was employed prior to polymerization. • Films as thin as ≈ 7 nm were deposited using different surfactant/counter ions. • Chemistry of the counter ion affects thickness, conductivity and morphology. • Lower thickness/higher conductivity were obtained by structurally flexible dopants

  7. Effect of anionic dopants on thickness, morphology and electrical properties of polypyrrole ultra-thin films prepared by in situ chemical polymerization

    Energy Technology Data Exchange (ETDEWEB)

    Mahmoodian, Mehrnoosh [Dep. of Polymer Engineering, Nanostructured Materials Research Center, Sahand University of Technology, Tabriz 51335-1996 (Iran, Islamic Republic of); Pourabbas, Behzad, E-mail: pourabas@sut.ac.ir [Dep. of Polymer Engineering, Nanostructured Materials Research Center, Sahand University of Technology, Tabriz 51335-1996 (Iran, Islamic Republic of); Mohajerzadeh, Shams [Nano-Electronics and Thin Film Lab, School of Electrical and Computer Engineering, University of Tehran, P.O. Box 14395/515, Tehran (Iran, Islamic Republic of)

    2015-05-29

    The effect of different dopant anions on deposition and characteristics of polypyrrole (PPy) thin film has been studied in this work. Ultra-thin films of conducting PPy were deposited on insulating surfaces of glass and oxidized silicon wafer by in situ chemical polymerization in the presence of different anionic dopants including sodium dodecylbenzenesulfonate, sodium dodecyl sulfate, α-naphthalene sulfonic acid, anthraquinone-2-sulfonic acid sodium salt monohydrate/5-sulfosalicylic acid dehydrate, and camphor sulfonic acid. Hydrophilic/hydrophobic properties and morphology of the self-assembled monolayer of N-(3-trimethoxysilylpropyl)pyrrole, the surface modifying agent in this work, and PPy thin films were characterized before and after deposition by contact angle measurements, field emission scanning electron microscopy, and atomic force microscopy. Chemical structure, thickness, and conductivity of the thin films were also studied by attenuated total reflectance Fourier transform infrared spectrometer, ellipsometry, and four-point probe measurements. The results showed deposition of thin films of conducting PPy with comparable thickness in the range of 6-31 nm and different morphologies, uniformity, and smoothness with average roughness in the range of 0.3-6 nm and relatively high range of conductivity on the modified surfaces. - Highlights: • Conducting thin films of polypyrrole were deposited on glass and SiO{sub 2} substrates. • Surface modification using pyrrole-silane was employed prior to polymerization. • Films as thin as ≈ 7 nm were deposited using different surfactant/counter ions. • Chemistry of the counter ion affects thickness, conductivity and morphology. • Lower thickness/higher conductivity were obtained by structurally flexible dopants.

  8. A new measurement method for effective aperture of thick pinhole

    International Nuclear Information System (INIS)

    Xie Hongwei; Zhang Jianhua; Zhang Faqiang; Li Linbo; Qi Jianmin; Chen Jinchuan; Chen Dingyang

    2014-01-01

    The Lucy-Richardson super resolution image processing technique, combined with the introduced virtual point spread function (PSF), was used to develop a measurement method of the processing precision of the superfine thick pinhole aperture. The principles of the technique were based on the known ideal image and degraded image. After the restoration and reconstruction of the degraded image with the introduced virtual point spread function (PSF), the comparison is made between the reconstructed image and the ideal image to judge the correctness of the virtual point spread function (PSF). During this process, the simulation of the effects of the point spread function (PSF) upon the image reconstruction was carried out at first. As indicated by the simulation, the ideal point spread function (PSF) used in the image restoration and reconstruction could provide ideal results of the image reconstruction. However, in the case of relatively bigger size of the point spread function (PSF), the reconstructed image would be obtained smaller than the ideal image. Besides, related experiments were carried out on the cobalt radiation sources. In the experiments, the aperture of the shielded collimator to restrict and align the radiation source was known to be l.0 mm, the thick pinholes respectively 0.7 mm and 0.45 mm in aperture were used for the imaging of the ϕl mm radiation source, and the radiation image was recorded in imaging plates 0.05 mm × O.05 mm in spatial resolution. Based on the hypothesis that the processing precision of the thick pinhole fulfill the experiment requirements, the point spread function obtained from the simulated computation was introduced into the restoration and reconstruction of the recorded images. At the area with an intensity of 50%, the thick pinhole with 0.7 mm aperture could provide homogenous image of the radiation source. However, the thick pinhole with 0.45 mm aperture provided an elliptical image with a major-minor axis ratio of 5 : 3

  9. Method for determining the optical constants of thin dielectric films with variable thickness using only their shrunk reflection spectra

    International Nuclear Information System (INIS)

    Ruiz-Perez, J.J.; Gonzalez-Leal, J.M.; Marquez, E.; Minkov, D.A.

    2001-01-01

    Thickness inhomogeneities in thin films have a large influence on their optical transmission and reflection spectra. If not taken into account, this may lead to rather large calculated values for the absorption coefficient or the erroneous presence of an absorption-band tail, as well as to significant errors in the calculated values of the refractive index and the film thickness. The effect of thickness variation on the optical reflection spectrum of a thin dielectric film covering a thick non-absorbing substrate, is analysed in detail in this paper, and analytical expressions are presented for such a reflection spectrum and its upper and lower envelopes. A method is suggested for determining the refractive index n(λ) and the extinction coefficient k(λ), as well as the average thickness and the thickness variation, of a thin dielectric film with variable thickness, by using only the two envelopes of the corresponding shrunk reflection spectrum. This method is used for the geometrical and optical characterization of thermally-evaporated amorphous chalcogenide films, deposited on glass substrates. (author)

  10. Analysis of thickness-dependent optical parameters of a-Si:H/nc-Si:H multilayer thin films

    Directory of Open Access Journals (Sweden)

    Ashok Kherodia

    2017-10-01

    Full Text Available Abstract Multilayer thin films with alternate hydrogenated amorphous (a-Si:H and nanocrystalline silicon (nc-Si:H layers are deposited in hot wire chemical vapor deposition (HWCVD chamber using hydrogen (H2 dilution of silane (SiH4. Two sets (two samples for each set have different nc-Si:H layer thickness with the same a-Si:H thickness. The transmittance spectra, refractive index and absorption coefficient are obtained using UV–Vis spectroscopy. An analysis of Tauc plot suggests thickness-dependent optical band gap shift. The films with thick nc-Si:H layers show a decrease in band gap from 1.78 to 1.68 eV, whereas the films with lower nc-Si:H layer thickness have an increased band gap from 1.64 to 1.72 eV. Further, the slope of the Tauc plot (B and disorder indicator (Urbach energy, E u show that the films with thick nc-Si:H layers are poorly ordered as hydrogen dilution increases. These results illustrate that band gap shift can be attributed to the crystal size effect and film disorder. This shifting of optical band gap with the nc-Si:H layer thickness is useful in tuning of the absorber layer band gap which finds an application in photovoltaics.

  11. Model, prediction, and experimental verification of composition and thickness in continuous spread thin film combinatorial libraries grown by pulsed laser deposition

    International Nuclear Information System (INIS)

    Bassim, N. D.; Schenck, P. K.; Otani, M.; Oguchi, H.

    2007-01-01

    Pulsed laser deposition was used to grow continuous spread thin film libraries of continuously varying composition as a function of position on a substrate. The thickness of each component that contributes to a library can be empirically modeled to a bimodal cosine power distribution. We deposited ternary continuous spread thin film libraries from Al 2 O 3 , HfO 2 , and Y 2 O 3 targets, at two different background pressures of O 2 : 1.3 and 13.3 Pa. Prior to library deposition, we deposited single component calibration films at both pressures in order to measure and fit the thickness distribution. Following the deposition and fitting of the single component films, we predict both the compositional coverage and the thickness of the libraries. Then, we map the thickness of the continuous spread libraries using spectroscopic reflectometry and measure the composition of the libraries as a function of position using mapping wavelength-dispersive spectrometry (WDS). We then compare the compositional coverage of the libraries and observe that compositional coverage is enhanced in the case of 13.3 Pa library. Our models demonstrate linear correlation coefficients of 0.98 for 1.3 Pa and 0.98 for 13.3 Pa with the WDS

  12. Gold nanoparticle plasmon resonance in near-field coupled Au NPs layer/Al film nanostructure: Dependence on metal film thickness

    Science.gov (United States)

    Yeshchenko, Oleg A.; Kozachenko, Viktor V.; Naumenko, Antonina P.; Berezovska, Nataliya I.; Kutsevol, Nataliya V.; Chumachenko, Vasyl A.; Haftel, Michael; Pinchuk, Anatoliy O.

    2018-05-01

    We study the effects of coupling between plasmonic metal nanoparticles and a thin metal film by using light extinction spectroscopy. A planar monolayer of gold nanoparticles located near an aluminum thin film (thicknesses within the range of 0-62 nm) was used to analyze the coupling between the monolayer and the thin metal film. SPR peak area increase for polymer coated Au NPs, non-monotonical behavior of the peak area for bare Au NPs, as well as red shift and broadening of SPR at the increase of the Al film thickness have been observed. These effects are rationalized as a result of coupling of the layer of Au NPs with Al film through the field of localized surface plasmons in Au NPs that causes the excitation of collective plasmonic gap mode in the nanostructure. An additional mechanism for bare Au NPs is the non-radiative damping of SPR that is caused by the electrical contact between metal NPs and film.

  13. Microstructure and thermoelectric properties of screen-printed thick-films of misfit-layered cobalt oxides with Ag addition

    DEFF Research Database (Denmark)

    Van Nong, Ngo; Samson, Alfred Junio; Pryds, Nini

    2012-01-01

    Thermoelectric properties of thick (~60 μm) films prepared by a screen-printing technique using p-type misfit-layered cobalt oxide Ca3Co4O9+δ with Ag addition have been studied. The screen-printed films were sintered in air at various temperatures ranging from 973 K to 1223 K. After each sintering...

  14. Solid surface tension measured by a liquid drop under a solid film.

    Science.gov (United States)

    Nadermann, Nichole; Hui, Chung-Yuen; Jagota, Anand

    2013-06-25

    We show that a drop of liquid a few hundred microns in diameter placed under a solid, elastic, thin film (∼10 μm thick) causes it to bulge by tens of microns. The deformed shape is governed by equilibrium of tensions exerted by the various interfaces and the solid film, a form of Neumann's triangle. Unlike Young's equation, which specifies the contact angles at the junction of two fluids and a (rigid) solid, and is fundamentally underdetermined, both tensions in the solid film can be determined here if the liquid-vapor surface tension is known independently. Tensions in the solid film have a contribution from elastic stretch and a constant residual component. The residual component, extracted by extrapolation to films of vanishing thickness and supported by analysis of the elastic deformation, is interpreted as the solid-fluid surface tension, demonstrating that compliant thin-film structures can be used to measure solid surface tensions.

  15. Infrared absorption study of hydrogen incorporation in thick nanocrystalline diamond films

    International Nuclear Information System (INIS)

    Tang, C.J.; Neves, A.J.; Carmo, M.C.

    2005-01-01

    We present an infrared (IR) optical absorbance study of hydrogen incorporation in nanocrystalline diamond films. The thick nanocrystalline diamond films were synthesized by microwave plasma-assisted chemical vapor deposition and a high growth rate about 3.0 μm/h was achieved. The morphology, phase quality, and hydrogen incorporation were assessed by means of scanning electron microscopy, Raman spectroscopy, and Fourier-transform infrared spectroscopy (FTIR). Large amount of hydrogen bonded to nanocrystalline diamond is clearly evidenced by the huge CH stretching band in the FTIR spectrum. The mechanism of hydrogen incorporation is discussed in light of the growth mechanism of nanocrystalline diamond. This suggests the potential of nanocrystalline diamond for IR electro-optical device applications

  16. Coupling effects in bilayer thick metal films perforated with rectangular nanohole arrays

    Directory of Open Access Journals (Sweden)

    Li Yuan

    2013-09-01

    Full Text Available The coupling effects in bilayer thick metal (silver films perforated with rectangular nanohole arrays are investigated using the finite-difference time-domain technique. Many interesting light phenomena are observed as the distance between the metal rectangular nanohole arrays varies. Coupling effects are found to play very important roles on the optical and electronic properties of bilayer metal rectangular nanohole arrays: antisymmetric coupling between surface plasmon polaritons near the top and bottom film plane, and antisymmetric coupling between localized surface plasmon resonances near the two long sides of the rectangular hole, are probably excited in each layer of bilayer metal rectangular nanohole arrays; antisymmetric and symmetric magnetic coupling probably occur between the metal rectangular nanohole arrays.

  17. 100-nm thick single-phase wurtzite BAlN films with boron contents over 10%

    KAUST Repository

    Li, Xiaohang

    2017-01-11

    Growing thicker BAlN films while maintaining single-phase wurtzite structure and boron content over 10% has been challenging. In this study, we report on the growth of 100 nm-thick single-phase wurtzite BAlN films with boron contents up to 14.4% by MOCVD. Flow-modulated epitaxy was employed to increase diffusion length of group-III atoms and reduce parasitic reactions between the metalorganics and NH3. A large growth efficiency of ∼2000 μm mol−1 was achieved as a result. Small B/III ratios up to 17% in conjunction with high temperatures up to 1010 °C were utilized to prevent formation of the cubic phase and maintain wurtzite structure.

  18. Alignment of muscle precursor cells on the vertical edges of thick carbon nanotube films

    Energy Technology Data Exchange (ETDEWEB)

    Holt, Ian, E-mail: ian.holt@rjah.nhs.uk [Wolfson Centre for Inherited Neuromuscular Disease, RJAH Orthopaedic Hospital, Oswestry, Shropshire SY10 7AG (United Kingdom); Institute for Science and Technology in Medicine, Keele University, Keele, Staffordshire ST5 5BG (United Kingdom); Gestmann, Ingo, E-mail: Ingo.Gestmann@fei.com [FEI Europe B.V., Achtseweg Noord 5, 5651 Eindhoven (Netherlands); Wright, Andrew C., E-mail: a.wright@glyndwr.ac.uk [Advanced Materials Research Laboratory, Glyndwr University, Plas Coch, Mold Rd, Wrexham LL11 2AW (United Kingdom)

    2013-10-15

    The development of scaffolds and templates is an essential aspect of tissue engineering. We show that thick (> 0.5 mm) vertically aligned carbon nanotube films, made by chemical vapour deposition, can be used as biocompatible substrates for the directional alignment of mouse muscle cells where the cells grow on the exposed sides of the films. Ultra high resolution scanning electron microscopy reveals that the films themselves consist mostly of small diameter (10 nm) multi-wall carbon nanotubes of wavy morphology with some single wall carbon nanotubes. Our findings show that for this alignment to occur the nanotubes must be in pristine condition. Mechanical wiping of the films to create directional alignment is detrimental to directional bioactivity. Larger areas for study have been formed from a composite of multiply stacked narrow strips of nanotubes wipe-transferred onto elastomer supports. These composite substrates appear to show a useful degree of alignment of the cells. Highlights: • Highly oriented muscle precursor cells grown on edges of carbon nanotube pads • Mechanical treatment of nanotube pads highly deleterious to cell growth on edges • Larger areas created from wipe-transfer of narrow strips of nanotubes onto elastomer supports • Very high resolution SEM reveals clues to aligned cell growth.

  19. Investigation of thickness dependent composition of boron carbide thin films by resonant soft x-ray reflectivity

    OpenAIRE

    Rao, P. N.; Gupta, R. K.; Saravanan, K.; Bose, A.; Joshi, S. C.; Ganguli, T.; Rai, S. K.

    2017-01-01

    Boron carbide thin films of different thicknesses deposited by ion beam sputtering were studied. The deposited films were characterized by grazing incidence hard x-ray reflectivity (GIXR), resonant soft x-ray reflectivity (RSXR), x-ray photo electron spectroscopy (XPS), resonant Rutherford backscattering spectrometry (RRBS), and time of flight secondary ion mass spectrometry (TOF-SIMS). An in-depth profile of the chemical elements constitute the films is reconstructed based on analysis of ref...

  20. Room temperature magnetism of few-nanometers-thick Fe3O4(111) films on Pt(111) and Ru(0001) studied in ambient conditions

    International Nuclear Information System (INIS)

    Lewandowski, M.; Miłosz, Z.; Michalak, N.; Ranecki, R.; Sveklo, I.; Kurant, Z.; Maziewski, A.; Mielcarek, S.; Luciński, T.; Jurga, S.

    2015-01-01

    Few-nanometers-thick Fe 3 O 4 (111) films were epitaxially grown on Pt(111) and Ru(0001) single crystal supports by sequential iron deposition and oxidation in an ultra-high vacuum chamber. The growth of well-ordered magnetite films was confirmed by low energy electron diffraction. The films were covered with a protective Au layer and subjected to magnetic and structural studies in ambient conditions. Magnetic hysteresis loops, recorded using magneto-optical Kerr effect apparatus, confirmed magnetic ordering in both films at room temperature. The Kerr measurements indicated in-plane orientation of magnetization, which was supported by the lack of magnetic contrast in magnetic force microscopy images. Atomic force microscopy revealed significant differences in morphology of the films, tentatively attributed to different lattice mismatch with Pt(111) and Ru(0001) single crystal supports. - Highlights: • Few-nanometers-thick Fe 3 O 4 (111) films were grown on Pt(111) and Ru(0001). • Magnetic properties were studied using MOKE and AFM/MFM in ambient conditions. • The films exhibited in-plane magnetic ordering at room temperature. • Differences in magnetic properties were tentatively assigned to structural differences.

  1. Screen printed PZT/PZT thick film bimorph MEMS cantilever device for vibration energy harvesting

    DEFF Research Database (Denmark)

    Xu, R.; Lei, A.; Christiansen, T. L.

    2011-01-01

    We present a MEMS-based PZT/PZT thick film bimorph vibration energy harvester with an integrated silicon proof mass. The most common piezoelectric energy harvesting devices utilize a cantilever beam of a non piezoelectric material as support beneath or in-between the piezoelectric material....... It provides mechanical support but it also reduces the power output. Our device replaces the support with another layer of the piezoelectric material, and with the absence of an inactive mechanical support all of the stresses induced by the vibrations will be harvested by the active piezoelectric elements....

  2. Screen printed PZT/PZT thick film bimorph MEMS cantilever device for vibration energy harvesting

    DEFF Research Database (Denmark)

    Xu, Ruichao; Lei, Anders; Dahl-Petersen, Christian

    2012-01-01

    We present a microelectromechanical system (MEMS) based PZT/PZT thick film bimorph vibration energy harvester with an integrated silicon proof mass. Most piezoelectric energy harvesting devices use a cantilever beam of a non piezoelectric material as support beneath or in-between the piezoelectric...... materials; it provides mechanical support but it also reduces the power output. In our device we replace the support material with another layer of the piezoelectric material. With the absence of an inactive mechanical support all stresses induced by vibrations will be harvested by the active piezoelectric...

  3. Analysis of electromigration phenomenon in thick-film and LTCC structures at elevated temperature

    Science.gov (United States)

    Nowak, Damian; Stafiniak, Andrzej; Dziedzic, Andrzej

    2014-06-01

    Studies on electromigration phenomenon in thick-film structures on alumina and LTCC substrates are presented in this paper. The effects of storage of Au and Ag electrode patterns in temperature range up to 300 °C under voltage bias were examined. The leakage characteristics of electrodes with 100 μm spacing at 50 V dc bias as a function of time and temperature are presented and analyzed. Scanning electron microscope (SEM) equipped with the energy-dispersive X-ray spectroscopy (EDX) detector was applied for determination of metal ions transport. Test structures with Au-based conductive material are much more resistant to electromigration than Ag-based layers.

  4. Detection of nitrogen dioxide using mixed tungsten oxide-based thick film semiconductor sensor.

    Science.gov (United States)

    Su, P-G; Ren-Jang, Wu; Fang-Pei, Nieh

    2003-03-10

    The thick film semiconductor sensor for NO(2) gas detection was fabricated by screen-printing method using a mixed WO(3)-based as sensing material. The sensing characteristics, such as response time, response linearity, sensitivity, working range, cross sensitivity, and long-term stability were further studied by using a WO(3)-based mixed with different metal oxides (SnO(2), TiO(2) and In(2)O(3)) and doped with noble metals (Au, Pd and Pt) as sensing materials was observed. The highest sensitivity for low concentrations (SnO(2)-Au as sensing material.

  5. Determination of refractive index, extinction coefficient and thickness of thin films by the method of waveguide mode excitation

    Energy Technology Data Exchange (ETDEWEB)

    Sokolov, V I; Marusin, N V; Panchenko, V Ya; Savelyev, A G; Seminogov, V N; Khaydukov, E V [Institute on Laser and Information Technologies, Russian Academy of Sciences, Shatura, Moscow Region (Russian Federation)

    2013-12-31

    We propose a method for measuring simultaneously the refractive index n{sub f}, extinction coefficient m{sub f} and thickness H{sub f} of thin films. The method is based on the resonant excitation of waveguide modes in the film by a TE- or a TM-polarised laser beam in the geometry of frustrated total internal reflection. The values of n{sub f}, m{sub f} and H{sub f} are found by minimising the functional φ = [N{sup -1}Σ{sup N}{sub i=1}(R{sub exp}(θ{sub i}) – R{sub thr}(θ{sub i})){sup 2}]{sup 1/2}, where R{sub exp}(θ{sub i}) and R{sub thr}(θ{sub i}) are the experimental and theoretical coefficients of reflection of the light beam from the interface between the measuring prism and the film at an angle of incidence θ{sub i}. The errors in determining n{sub f}, m{sub f} and H{sub f} by this method are ±2 × 10{sup -4}, ±1 × 10{sup -3} and ±0.5%, respectively. (fiber and integrated optics)

  6. Influence of test capacitor features on piezoelectric and dielectric measurement of ferroelectric films.

    Science.gov (United States)

    Wang, Zhihong; Lau, Gih Keong; Zhu, Weiguang; Chao, Chen

    2006-01-01

    This paper presents both theoretical and numerical analyses of the piezoelectric and dielectric responses of a highly idealized film-on-substrate system, namely, a polarized ferroelectric film perfectly bonded to an elastic silicon substrate. It shows that both effective dielectric and piezoelectric properties of the films change with the size and configuration of the test capacitor. There exists a critical electrode size that is smaller than the diameter of the commonly used substrate. The effective film properties converge to their respective constrained values as capacitor size increases to the critical size. If capacitor size is smaller than the critical size, the surface displacement at the top electrode deviates from the net thickness change in response to an applied voltage because the film is deformable at the film/substrate interface. The constrained properties of the films depend only on those of bulk ferroelectrics but are independent of film thickness and substrate properties. The finding of the critical capacitor size together with analytical expressions of the constrained properties makes it possible to realize consistent measurement of piezoelectric and dielectric properties of films. A surface scanning technique is recommended to measure the profile of piezoresponses of the film so that the constrained properties of the film can be identified accurately.

  7. The effect of zinc thickness on corrosion film breakdown of Colombian galvanized steel

    Science.gov (United States)

    Sandoval-Amador, A.; E Torres Ramirez, J.; Cabrales-Villamizar, P. A.; Laverde Cataño, D.; Y Peña-Ballesteros, D.

    2017-12-01

    This work studies the corrosion behaviour of Colombian galvanized steel in solutions of chloride and sulphate ions. The effect of the thickness and exposure time on the film’s breakdown susceptibility and protectiveness of the corrosion products were studied using potentiodynamic polarization curves and electrochemical impedance spectroscopy. The corrosion products were analysed using SEM-EDS and XRD. The samples with a higher thickness level in the zinc film (Z180) have the lowest corrosion rate. In this case, one of the products that was formed by the chemical reactions that occurred was Zinc hydroxide, which exhibits a passive behaviour as observed in the Pourbaix curves of the obtained potentials and in how the different Ph levels of the solutions worked. The sheets with the highest thickness (Z180) had the best performance, since at the end of the study they showed the least amount of damage on the surface of the zinc layer. This is because the thickness of the zinc layer favours the formation of simonkolleite, which is the corrosion product that protects the material under the conditions of the study.

  8. 3{omega} measurements of half-Heusler thin films using a passive circuit

    Energy Technology Data Exchange (ETDEWEB)

    Mix, Christian; Jaeger, Tino; Jakob, Gerhard [Institut fuer Physik, Universitaet Mainz, Staudinger Weg 7, 55128 Mainz (Germany)

    2011-07-01

    One possibility to increase the thermoelectric Figure-of-Merit of thin films is to decrease the thermal conductivity, by replacing the thin film with a superlattice of the same thickness. This is one of the major challenges in ongoing research. For this purpose a 3{omega}-measurement system is built up to obtain the thermal conductivity of thin films. To nullify influences of active elements, a setup including a wheatstone bridge is used. Different aspects of the measurement system like the influence of thermal penetration depth and the energy losses by atmosphere are discussed. Additionally, first results on Half-Heusler thin films and superlattices are presented.

  9. Wall Thickness Measurement Of Insulated Pipe By Tangential Radiography Technique Using Ir 192

    International Nuclear Information System (INIS)

    Soedarjo

    2000-01-01

    Insulation pipe wall thickness by tangential radiography technique has been carried out using 41 Curie Iridium 192 source has activity for two carbon steel pipes. The outer diameter of the first pipe is 90 mm, wall thickness is 75.0 mm, source film film distance is 609.5 mm, source tangential point of insulation is 489.5 mm and exposure time 3 minute and 25 second. From the calculation, the first pipe thickness is found to be 12.54 mm and for the second pipe is 8.42 mm. The thickness is due to inaccuracy in reading the pipe thickness on radiography film and the geometry distortion radiation path

  10. LPG and NH3 Sensing Properties of SnO2 Thick Film Resistors Prepared by Screen Printing Technique

    OpenAIRE

    A. S. GARDE

    2010-01-01

    The gas sensing behavior of SnO2 thick film resistors deposited on alumina substrates has been investigated for LPG and NH3 gas. The standard screen printing technology was used to prepare the thick films. The films were fired at optimized temperature of 780 0C for 30 minutes. The material characterization was performed by XRD, SEM, FTIR, UV and EDAX for elemental analysis. IR spectroscopy analysis at 2949.26 cm-1 showed the peak assigned to the –Sn-H vibration due to the effect of hybridizat...

  11. Terahertz thickness measurements for real industrial applications: from automotive paints to aerospace industry (Conference Presentation)

    Science.gov (United States)

    Krimi, Soufiene; Beigang, René

    2017-02-01

    In this contribution, we present a highly accurate approach for real-time thickness measurements of multilayered coatings using terahertz time domain spectroscopy in reflection geometry. The proposed approach combines the benefits of a model-based material parameters extraction method to calibrate the specimen under test, a generalized modeling method to simulate the terahertz radiation behavior within arbitrary thin films, and the robustness of a powerful evolutionary optimization algorithm to increase the sensitivity and the precision of the minimum thickness measurement limit. Furthermore, a novel self-calibration model is introduced, which takes into consideration the real industrial challenges such as the effect of wet-on-wet spray in the car painting process and the influence of the spraying conditions and the sintering process on ceramic thermal barrier coatings (TBCs) in aircraft industry. In addition, the developed approach enables for some applications the simultaneous determination of the complex refractive index and the coating thickness. Hence, a pre-calibration of the specimen under test is not required for such cases. Due to the high robustness of the self-calibration method and the genetic optimization algorithms, the approach has been successfully applied to resolve individual layer thicknesses within multi-layered coated samples down to less than 10 µm. The regression method can be applied in time-domain, frequency-domain or in both the time and frequency-domain simultaneously. The data evaluation uses general-purpose computing on graphics processing units and thanks to the developed highly parallelized algorithm lasts less than 300 ms. Thus, industrial requirements for fast thickness measurements with an "every-second-cycle" can be fulfilled.

  12. Surface dose extrapolation measurements with radiographic film

    International Nuclear Information System (INIS)

    Butson, Martin J; Cheung Tsang; Yu, Peter K N; Currie, Michael

    2004-01-01

    Assessment of surface dose delivered from radiotherapy x-ray beams for optimal results should be performed both inside and outside the prescribed treatment fields. An extrapolation technique can be used with radiographic film to perform surface dose assessment for open field high energy x-ray beams. This can produce an accurate two-dimensional map of surface dose if required. Results have shown that the surface percentage dose can be estimated within ±3% of parallel plate ionization chamber results with radiographic film using a series of film layers to produce an extrapolated result. Extrapolated percentage dose assessment for 10 cm, 20 cm and 30 cm square fields was estimated to be 15% ± 2%, 29% ± 3% and 38% ± 3% at the central axis and relatively uniform across the treatment field. The corresponding parallel plate ionization chamber measurements are 16%, 27% and 37%, respectively. Surface doses are also measured outside the treatment field which are mainly due to scattered electron contamination. To achieve this result, film calibration curves must be irradiated to similar x-ray field sizes as the experimental film to minimize quantitative variations in film optical density caused by varying x-ray spectrum with field size. (note)

  13. Comparison of Film Thickness of Two Commercial Brands of Glass lonomer Cement and One Dual-cured Composite: An in vitro Study.

    Science.gov (United States)

    Khajuria, Rajat R; Singh, Rishav; Barua, Pranamee; Hajira, Nausheen; Gupta, Naveen; Thakkar, Rohit R

    2017-08-01

    The present study is undertaken to examine the film thickness of three most commonly used luting cements and to determine their usage as a luting agent. This study was carried out strictly according to the guidelines of American Dental Association (ADS) specification no. 8. Two glass slabs of 5 cm in length and 2 cm in width were used. One glass slab was kept over the other glass slab and the space between the two glass slabs was measured using metallurgical microscope at the power of 10*. Two brands of glass ionomer cement (GIC) and one dual-cured resin cement were used in this study. The test cement is sandwiched between two glass slabs. A static load of 15 kg was applied using universal testing machine on the glass slabs for 1 hour and the space present between the two glass slabs was measured using metallurgical microscope at the power of 10*. Greatest film thickness was found in group III (Paracore) followed by group II (micron) and lowest in group I (GC luting and lining cement). All the tested samples can be used for luting purposes. Greatest film thickness was observed in Paracore followed by micron and lowest in GC luting and lining cement. This suggests that the 25 to 27°C is ideal for mixing of the cement when used for luting consistency. The cement with film thickness more than 30 urn should never be used for luting purposes. The dentist should choose the luting cement with utmost care noting the film thickness and bond strength of the cement. The cement with low exothermic heat production and good bond strength should be encouraged.

  14. Investigation of Shear-Thinning Behavior on Film Thickness and Friction Coefficient of Polyalphaolefin Base Fluids With Varying Olefin Copolymer Content

    Energy Technology Data Exchange (ETDEWEB)

    Zolper, Thomas J.; He, Yifeng; Delferro, Massimiliano; Shiller, Paul; Doll, Gary; LotfizadehDehkordi, Babak; Ren, Ning; Lockwood, Frances; Marks, Tobin J.; Chung, Yip-Wah; Greco, Aaron; Erdemir, Ali; Wang, Qian

    2016-08-11

    This study investigates the rheological properties, elastohydrodynamic (EHD) film-forming capability, and friction coefficients of low molecular mass poly-alpha-olefin (PAO) base stocks with varying contents of high molecular mass olefin copolymers (OCPs) to assess their shear stability and their potential for energy-efficient lubrication. Several PAO-OCP mixtures were blended in order to examine the relationship between their additive content and tribological performance. Gel permeation chromatography (GPC) and nuclear magnetic resonance (NMR) spectroscopy were used to characterize the molecular masses and structures, respectively. Density, viscosity, EHD film thickness, and friction were measured at 303 K, 348 K, and 398 K. Film thickness and friction were studied at entrainment speeds relevant to the boundary, mixed, and full-film lubrication regimes. The PAO-OCP mixtures underwent temporary shear-thinning resulting in decreases in film thickness and hydrodynamic friction. These results demonstrate that the shear characteristics of PAO-OCP mixtures can be tuned with the OCP content and provide insight into the effects of additives on EHD characteristics.

  15. 31-mode piezoelectric micromachined ultrasonic transducer with PZT thick film by granule spraying in vacuum process

    Science.gov (United States)

    Jung, Joontaek; Annapureddy, Venkateswarlu; Hwang, Geon-Tae; Song, Youngsup; Lee, Wonjun; Kang, Woojin; Ryu, Jungho; Choi, Hongsoo

    2017-05-01

    A piezoelectric micromachined ultrasonic transducer (pMUT) is an ideal device for portable medical diagnosis systems, intravascular ultrasound systems, and ultrasonic cameras because of its favorable characteristics including small size, acoustic impedance matching with the body, low power consumption, and simple integration with the systems. Despite these advantages, practical applications are limited because of insufficient acoustic pressure of the pMUT caused by the thin active piezoelectric layer. Here, we report the fabrication of a thick piezoelectric Pb(Zr,Ti)O3 (PZT) film-based pMUT device having high deflection at low driving voltage using the granule spraying in vacuum (GSV) process. Pre-patterned high-density thick (exceeding 8 μm) PZT films were grown on 6-inch-diameter Si/SiO2/Ti/Pt silicon-on-insulator wafers at room temperature at a high deposition rate of ˜5 μm min-1. The fabrication process using the proposed GSV process was simple and fast, and the deflection of the pMUT exhibited a high value of 0.8 μm.

  16. Measurement of the through thickness compression of a battery separator

    Science.gov (United States)

    Yan, Shutian; Huang, Xiaosong; Xiao, Xinran

    2018-04-01

    The mechanical integrity of the separator is critical to the reliable operation of a battery. Due to its minimal thickness, compression experiments with a single/a few layers of separator are difficult to perform. In this work, a capacitance based displacement set-up has been developed for the measurement of the through thickness direction (TTD) compression stress-strain behavior of the separator and the investigation of its interaction with the electrode. The experiments were performed for a stack of two layers of Celgard 2400 separator, NMC cathode, and separator/NMC cathode/separator stack in both dry and wet (i.e. submersed in dimethyl carbonate DMC) conditions. The experimental results reveal that the separator compression modulus can be significantly affected by the presence of DMC. The iso-stress based rule of mixtures was used to compute the compressive stress-strain curve for the stack from that of the separator and NMC layer. The computed curve agreed with the experimental curve reasonably well up to about 0.16 strain but deviated significantly to a softer response at higher strains. The results suggest that, in the stack, the TTD compressive deformation of the separator is influenced by the NMC cathode.

  17. Surface study and thickness control of thin Al2O3 film on Cu-9%Al(111) single crystal

    International Nuclear Information System (INIS)

    Yamauchi, Yasuhiro; Yoshitake, Michiko; Song Weijie

    2004-01-01

    We were successful in growing a uniform flat Al 2 O 3 film on the Cu-9%Al(111) surface using the improved cleaning process, low ion energy and short time sputtering. The growth of ultra-thin film of Al 2 O 3 on Cu-9%Al was investigated using Auger electron spectroscopy (AES) and a scanning electron microscope (SEM). The Al 2 O 3 film whose maximum thickness was about 4.0 nm grew uniformly on the Cu-9%Al surface. The Al and O KLL Auger peaks of Al 2 O 3 film shifted toward low kinetic energy, and the shifts were related to Schottky barrier formation and band bending at the Al 2 O 3 /Cu-9%Al interface. The thickness of Al 2 O 3 film on the Cu-9%Al surface was controlled by the oxygen exposure

  18. Origin of thickness dependence of structural phase transition temperatures in highly strained BiFeO3 thin films

    Directory of Open Access Journals (Sweden)

    Yongsoo Yang

    2016-03-01

    Full Text Available Two structural phase transitions are investigated in highly strained BiFeO3 thin films as a function of film thickness and temperature via synchrotron x-ray diffraction. Both transition temperatures (upon heating: monoclinic MC to monoclinic MA to tetragonal decrease as the film becomes thinner. A film-substrate interface layer, evidenced by half-order peaks, contributes to this behavior, but at larger thicknesses (above a few nanometers, the temperature dependence results from electrostatic considerations akin to size effects in ferroelectric phase transitions, but observed here for structural phase transitions within the ferroelectric phase. For ultra-thin films, the tetragonal structure is stable to low temperatures.

  19. Synthesis and Characterization of Vanadium Doped Zinc Oxide Thick Film for Chemical Sensor Application

    Directory of Open Access Journals (Sweden)

    Rayees Ahmad Zargar

    2015-01-01

    Full Text Available Zinc oxide and vanadium pentoxide nanoparticles derived by chemical coprecipitation route were used to cast Zn0.96V0.04O thick film by screen printing method. The structural, morphological, optical, and electrical properties of the film were characterized by powder XRD, SEM, Raman, UV-VIS, and DC conductivity techniques. XRD pattern, SEM image, and Raman spectrum of the film confirm the single phase formation of Wurtzite structure with preferential orientation along [101] plane, minor variation in lattice parameters, and vanadium ions substitution at zinc sites. Zn0.96V0.04O pellet has been used for sensing ammonia vapor concentrations in 20–50°C temperature range which exhibits maximum responsiveness and sensitivity at 30°C. The minor variations in resistance are observed with ammonia vapor concentration. The adsorption of ammonia vapors through weak hydrogen bonding and its insertion into lattice by nitrogen lone pairs donation at vacant/defect sites in lattice caused by vanadium doping are considered to explain gas sensing mechanism.

  20. Water-in-model oil emulsions studied by small-angle neutron scattering: interfacial film thickness and composition.

    Science.gov (United States)

    Verruto, Vincent J; Kilpatrick, Peter K

    2008-11-18

    The ever-increasing worldwide demand for energy has led to the upgrading of heavy crude oil and asphaltene-rich feedstocks becoming viable refining options for the petroleum industry. Traditional problems associated with these feedstocks, particularly stable water-in-petroleum emulsions, are drawing increasing attention. Despite considerable research on the interfacial assembly of asphaltenes, resins, and naphthenic acids, much about the resulting interfacial films is not well understood. Here, we describe the use of small-angle neutron scattering (SANS) to elucidate interfacial film properties from model emulsion systems. Modeling the SANS data with both a polydisperse core/shell form factor as well as a thin sheet approximation, we have deduced the film thickness and the asphaltenic composition within the stabilizing interfacial films of water-in-model oil emulsions prepared in toluene, decalin, and 1-methylnaphthalene. Film thicknesses were found to be 100-110 A with little deviation among the three solvents. By contrast, asphaltene composition in the film varied significantly, with decalin leading to the most asphaltene-rich films (30% by volume of the film), while emulsions made in toluene and methylnaphthalene resulted in lower asphaltenic contents (12-15%). Through centrifugation and dilatational rheology, we found that trends of decreasing water resolution (i.e., increasing emulsion stability) and increasing long-time dilatational elasticity corresponded with increasing asphaltene composition in the film. In addition to the asphaltenic composition of the films, here we also deduce the film solvent and water content. Our analyses indicate that 1:1 (O/W) emulsions prepared with 3% (w/w) asphaltenes in toluene and 1 wt % NaCl aqueous solutions at pH 7 and pH 10 resulted in 80-90 A thick films, interfacial areas around 2600-3100 cm (2)/mL, and films that were roughly 25% (v/v) asphaltenic, 60-70% toluene, and 8-12% water. The increased asphaltene and water film

  1. Speed of Sound and Materials Thickness Measuring by Ultrasound

    Directory of Open Access Journals (Sweden)

    Carlos Dias Maciel

    2002-01-01

    Full Text Available Nowadays, ultrasound pulse-echo systems are commonly used as a diagnostic tool, due to its advantageous characteristics such as being a non-destructive analysis method and having a millimeter range resolution for the currently used frequencies. Considering these and other qualities, this study intends to develop a system for measuring and analyzing physical properties of some materials. Using a data acquisition system in a microcomputer, electrical (voltage pulses are generated to agitate a transducer that sends a pressure pulse towards the sample. This same transducer receives the echo reflected from the material, converts the mechanical energy into an electrical one, transforming it into information, which is processed later using a mathematical computer program. With this process, the values of the sound speed and the signal attenuation in the sample are obtained, plus its thickness with a minor error.

  2. Thickness controlled sol-gel silica films for plasmonic bio-sensing devices

    Energy Technology Data Exchange (ETDEWEB)

    Figus, Cristiana, E-mail: cristiana.figus@dsf.unica.it; Quochi, Francesco, E-mail: cristiana.figus@dsf.unica.it; Artizzu, Flavia, E-mail: cristiana.figus@dsf.unica.it; Saba, Michele, E-mail: cristiana.figus@dsf.unica.it; Marongiu, Daniela, E-mail: cristiana.figus@dsf.unica.it; Mura, Andrea; Bongiovanni, Giovanni [Dipartimento di Fisica - University of Cagliari, S.P. Km 0.7, I-09042 Monserrato (Canada) (Italy); Floris, Francesco; Marabelli, Franco; Patrini, Maddalena; Fornasari, Lucia [Dipartimento di Fisica - University of Pavia, Via Agostino Bassi 6, I-27100 Pavia (PV) (Italy); Pellacani, Paola; Valsesia, Andrea [Plasmore S.r.l. -Via Grazia Deledda 4, I-21020 Ranco (Vatican City State, Holy See) (Italy)

    2014-10-21

    Plasmonics has recently received considerable interest due to its potentiality in many fields as well as in nanobio-technology applications. In this regard, various strategies are required for modifying the surfaces of plasmonic nanostructures and to control their optical properties in view of interesting application such as bio-sensing, We report a simple method for depositing silica layers of controlled thickness on planar plasmonic structures. Tetraethoxysilane (TEOS) was used as silica precursor. The control of the silica layer thickness was obtained by optimizing the sol-gel method and dip-coating technique, in particular by properly tuning different parameters such as pH, solvent concentration, and withdrawal speed. The resulting films were characterized via atomic force microscopy (AFM), Fourier-transform (FT) spectroscopy, and spectroscopic ellipsometry (SE). Furthermore, by performing the analysis of surface plasmon resonances before and after the coating of the nanostructures, it was observed that the position of the resonance structures could be properly shifted by finely controlling the silica layer thickness. The effect of silica coating was assessed also in view of sensing applications, due to important advantages, such as surface protection of the plasmonic structure.

  3. In situ Raman spectroscopy of topological insulator BiTe films with varying thickness

    DEFF Research Database (Denmark)

    Wang, C.; Zhu, X.; Nilsson, Louis

    2013-01-01

    Topological insulators (TIs) are a new state of quantum matter with a band gap in bulk and conducting surface states. In this work, the Raman spectra of topological insulator Bi2Te3 films prepared by molecular beam epitaxy (MBE) have been measured by an in situ ultrahigh vacuum (UHV...

  4. Study of the optical properties and structure of ZnSe/ZnO thin films grown by MOCVD with varying thicknesses

    Energy Technology Data Exchange (ETDEWEB)

    Jabri, S., E-mail: slaheddine.jabri@fst.rnu.tn [Unité des nanomatériaux et photoniques, Faculté des Sciences de Tunis, Campus Universitaire Ferhat Hachad, El Manar, 2092 Tunis (Tunisia); Amiri, G.; Sallet, V. [Groupe d’Etude de la Matière Condensée, CNRS-Université de Versailles St Quentin, Université Paris-Saclay, 45 avenue des Etats Unis, 78035 Versailles Cedex (France); Souissi, A. [Laboratoire de Photovoltaïque, Centre de Recherches et des Technologies de l’Energie, Technopole Borj Cedria, B.P. 95, Hammammlif 2050 (Tunisia); Meftah, A. [Unité des nanomatériaux et photoniques, Faculté des Sciences de Tunis, Campus Universitaire Ferhat Hachad, El Manar, 2092 Tunis (Tunisia); Galtier, P. [Groupe d’Etude de la Matière Condensée, CNRS-Université de Versailles St Quentin, Université Paris-Saclay, 45 avenue des Etats Unis, 78035 Versailles Cedex (France); Oueslati, M. [Unité des nanomatériaux et photoniques, Faculté des Sciences de Tunis, Campus Universitaire Ferhat Hachad, El Manar, 2092 Tunis (Tunisia)

    2016-05-15

    ZnSe layers were grown on ZnO substrates by the metal organic chemical vapor deposition technique. A new structure appeared at lower thicknesses films. The structural properties of the thin films were studied by the X-ray diffraction (XRD) and Raman spectroscopy methods. First, Raman selection rules are explicitly put forward from a theoretical viewpoint. Second, experimentally-retrieved-intensities of the Raman signal as a function of polarization angle of incident light are fitted to the obtained theoretical dependencies in order to confirm the crystallographic planes of zinc blend ZnSe thin film, and correlate with DRX measurements. Raman spectroscopy has been used to characterize the interfacial disorder that affects energy transport phenomena at ZnSe/ZnO interfaces and the Photoluminescence (PL) near the band edge of ZnSe thin films.

  5. Thickness-Dependent Order-to-Order Transitions of Bolaform-like Giant Surfactant in Thin Films

    Energy Technology Data Exchange (ETDEWEB)

    Hsu, Chih-Hao; Yue, Kan; Wang, Jing; Dong, Xue-Hui; Xia, Yanfeng; Jiang, Zhang [X-ray; Thomas, Edwin L. [Department; Cheng, Stephen Z. D.

    2017-09-07

    Controlling self-assembled nanostructures in thin films allows the bottom-up fabrication of ordered nanoscale patterns. Here we report the unique thickness-dependent phase behavior in thin films of a bolaform-like giant surfactant, which consists of butyl- and hydroxyl-functionalized polyhedral oligomeric silsesquioxane (BPOSS and DPOSS) cages telechelically located at the chain ends of a polystyrene (PS) chain with 28 repeating monomers on average. In the bulk, BPOSS-PS28-DPOSS forms a double gyroid (DG) phase. Both grazing incidence small angle X-ray scattering and transmission electron microscopy techniques are combined to elucidate the thin film structures. Interestingly, films with thicknesses thinner than 200 nm exhibit an irreversible phase transition from hexagonal perforated layer (HPL) to compressed hexagonally packed cylinders (c-HEX) at 130 °C, while films with thickness larger than 200 nm show an irreversible transition from HPL to DG at 200 °C. The thickness-controlled transition pathway suggests possibilities to obtain diverse patterns via thin film self-assembly.

  6. Relationship between deprotection and film thickness loss during plasma etching of positive tone chemically amplified resists

    International Nuclear Information System (INIS)

    Mahorowala, A.P.; Medeiros, D.R.

    2001-01-01

    Positive tone chemically amplified (CA) resists have demonstrated the sensitivity, contrast, and resolution necessary to print state-of-the-art subwavelength features using 248 nm and more recently 193 nm lithography. These materials are also being considered for printing sub-100 nm features with 157 nm and next-generation lithography technologies such as extreme ultraviolet and electron beam projection lithography. The basis for solubility differential and image formation in these resists is the acid catalyzed deprotection of labile protecting groups of an inherently base soluble polymer. The deprotection is effected by the photochemical generation of strong acid during the exposure process. Such acid-catalyzed deprotection reactions can also occur in unexposed resist areas when etched in a plasma. This can be due to UV exposure, high-energy ion bombardment, elevated substrate temperatures, or interaction of the resist surface with plasma species to form acidic moieties. Deprotection has been associated with resist mass loss and film shrinkage during plasma etching, leaving inadequate masking material for the entire etch step. In this article, we report the film thickness loss of several unexposed CA resists as a function of etch time in a variety of plasmas and correlate these data with film composition, monitored by Fourier transform infrared spectroscopy. These results are compared with theoretical predictions based on generally accepted deprotection mechanisms. Our findings indicate that the 'acidic' nature of certain plasmas such as Cl 2 /O 2 can result in deprotection in the resist film, even in the absence of a photoacid generator. Additionally, the data suggest that the nature of the resist polymer and, in turn, the identity of the deprotection products directly influence resist mass loss and etch rate linearity, both of which can be controlled by careful selection of resist materials

  7. Spin wave propagation in perpendicularly magnetized nm-thick yttrium iron garnet films

    Science.gov (United States)

    Chen, Jilei; Heimbach, Florian; Liu, Tao; Yu, Haiming; Liu, Chuanpu; Chang, Houchen; Stückler, Tobias; Hu, Junfeng; Zeng, Lang; Zhang, Youguang; Liao, Zhimin; Yu, Dapeng; Zhao, Weisheng; Wu, Mingzhong

    2018-03-01

    Magnonics offers a new way for information transport that uses spin waves (SWs) and is free of charge currents. Unlike Damon-Eshbach SWs, the magneto-static forward volume SWs offer the reciprocity configuration suitable for SW logic devices with low power consumption. Here, we study forward volume SW propagation in yttrium iron garnet (YIG) thin films with an ultra-low damping constant α = 8 ×10-5 . We design different integrated microwave antenna with different k-vector excitation distributions on YIG thin films. Using a vector network analyzer, we measured SW transmission with the films magnetized in perpendicular orientation. Based on the experimental results, we extract the group velocity as well as the dispersion relation of SWs and directly compare the power efficiency of SW propagation in YIG using coplanar waveguide and micro stripline for SW excitation and detection.

  8. Nanonails structured ferric oxide thick film as room temperature liquefied petroleum gas (LPG) sensor

    Science.gov (United States)

    Yadav, B. C.; Singh, Satyendra; Yadav, Anuradha

    2011-01-01

    In the present work, ferric oxide nanonails were prepared by screen printing method on borosilicate glass substrate and their electrical and LPG sensing properties were investigated. The structural and morphological characterizations of the material were analyzed by means of X-ray diffraction (XRD) and Scanning electron microscopy (SEM). XRD pattern revealed crystalline α-phase and rhombohedral crystal structure. SEM images show nanonails type of morphology throughout the surface. Optical characterization of the film was carried out by UV-visible spectrophotometer. By Tauc plot the estimated value of band gap of film was found 3.85 eV. The LPG sensing properties of the ferric oxide film were investigated at room temperature for different vol.% of LPG. The variations in electrical resistance of the film were measured with the exposure of LPG as a function of time. The maximum values of sensitivity and sensor response factors were found 51 and 50 respectively for 2 vol.% of LPG. The activation energy calculated from Arrhenius plot was found 0.95 eV. The response and recovery time of sensing film were found ˜120 s and 150 s respectively. These experimental results show that nanonails structured ferric oxide is a promising material as LPG sensor.

  9. Optical 3D shape measurement for nano-scale thin film buckling

    Science.gov (United States)

    Wang, S. B.; Xiao, Y.; Jia, H. K.; Li, L. A.

    2008-11-01

    This research focused on observing and measuring the 3D shape for nano-scale thin film buckling of 150nm Ti-film material deposited on organic glass substrates. With the aid of an optical microscope (2000×), the particular approaches were designed using optical wedge stepped in horizontal displacement approach and micro mechanical vertical displacement approach. The 3D shape measurement of thin film buckling on nano-scale level was carried out based on focusing-evaluation-function theory, gaussian interpolation and other theories related to digital image. After comparing the different measuring results and data from different focusing evaluation functions, an error analysis was established on the nature of such functions. In this experiment, we only focused on the measurement on the 3D shape for 150nm-thick thin film buckling. This research makes promotion in measurement on 3D shape of thin film buckling on nano-scale level.

  10. Enhancement in (BHmax of PLD-made isotropic Nd-Fe-B thick film magnets deposited on Si substrates

    Directory of Open Access Journals (Sweden)

    M. Nakano

    2017-05-01

    Full Text Available Increase in Nd contents of a PLD-made isotropic Nd-Fe-B thick-film magnet enabled us to enhance the thickness of the film magnet deposited on a Si substrate because the linear expansion coefficient of Nd is an intermediate value between Nd2Fe14B and Si. The large amount of Nd, however, degraded the residual magnetic polarization and (BHmax. In the study, we reduced the Nd contents of each Nd-Fe-B film by inserting a Nd or a Nd-rich Nd-Fe-B buffer layer between a Nd-Fe-B film and a Si substrate in order to suppress the mechanical destruction together with the improvement in magnetic properties. It was found that the mechanical property of a Nd-Fe-B film comprising the Nd-Fe-B buffer layer in the thickness range from 10 to 60 μm was superior than that of a sample with the Nd buffer layer. Resultantly, an average (BHmax value of Nd-Fe-B films with each Nd-Fe-B buffer layer deposited on Si substrates could be enhanced by approximately 15 kJ/m3 compared to that of non-buffer-layered films.

  11. Effects of mechanical properties of polymer on ceramic-polymer composite thick films fabricated by aerosol deposition

    Science.gov (United States)

    Kwon, Oh-Yun; Na, Hyun-Jun; Kim, Hyung-Jun; Lee, Dong-Won; Nam, Song-Min

    2012-05-01

    Two types of ceramic-polymer composite thick films were deposited on Cu substrates by an aerosol deposition process, and their properties were investigated to fabricate optimized ceramic-based polymer composite thick films for application onto integrated substrates with the advantage of plasticity. When polymers with different mechanical properties, such as polyimide (PI) and poly(methyl methacrylate) (PMMA), are used as starting powders together with α-Al2O3 powder, two types of composite films are formed with different characteristics - surface morphologies, deposition rates, and crystallite size of α-Al2O3. Through the results of micro-Vickers hardness testing, it was confirmed that the mechanical properties of the polymer itself are associated with the performances of the ceramic-polymer composite films. To support and explain these results, the microstructures of the two types of polymer powders were observed after planetary milling and an additional modeling test was carried out. As a result, we could conclude that the PMMA powder is distorted by the impact of the Al2O3 powder, so that the resulting Al2O3-PMMA composite film had a very small amount of PMMA and a low deposition rate. In contrast, when using PI powder, the Al2O3-PI composite film had a high deposition rate due to the cracking of PI particles. Consequently, it was revealed that the mechanical properties of polymers have a considerable effect on the properties of the resulting ceramic-polymer composite thick films.

  12. Improvement of a wall thinning rate model for liquid droplet impingement erosion. Implementation of liquid film thickness model with consideration of film behavior

    International Nuclear Information System (INIS)

    Morita, Ryo

    2014-01-01

    Liquid droplet impingement erosion (LDI) is defined as an erosion phenomenon caused by high-speed droplet attack in a steam flow. Pipe wall thinning by LDI is sometimes observed in a steam piping system of a power plant. As LDI usually occurs very locally and is difficult to detect, predicting LDI location is required for safe operation of power plant systems. Therefore, we have involved in the research program to develop prediction tools that will be used easily in actual power plants. Our previous researches developed a thinning rate evaluation model due to LDI (LDI model) and the evaluation system of the thinning rate and the thinning shape within a practically acceptable time (LDI evaluation system). Though the LDI model can include a cushioning effect of liquid film which is generated on the material surface by droplet impingement as an empirical equation with fluid parameter, the liquid film thickness is not clarified due to complex flow condition. In this study, to improve the LDI model and the LDI evaluation system, an analytical model of the liquid film thickness was proposed with consideration of the liquid film flow behavior on the material surface. The mass balance of the liquid film was considered, and the results of CFD calculations and existing researches were applied to obtain the liquid film thickness in this model. As a result of the LDI evaluation of the new LDI model with liquid film model, improvement of the LDI model was achieved. (author)

  13. Improved of effective wetting area and film thickness on a concentric helical bank of a generator for an absorption heat transformer

    International Nuclear Information System (INIS)

    Lazcano-Véliz, Y.; Hernández, J.A.; Juárez-Romero, D.; Huicochea-Rodríguez, A.; Álvarez-Gallegos, A.; Siqueiros, J.

    2016-01-01

    Highlights: • The falling film of lithium bromide - water was improved in the generator of an AHT. • The design of the distributor and the concentric tube helical bank was modified. • Wetting efficiency for different operation conditions was obtained. • Improved operation flow in the heat exchange system was determined. - Abstract: This work was performed in the generator of an absorption heat transformer (AHT) applied for water purification, which has two concentric helical coils. The AHT used LiBr-H 2 O to 55%wt for the heat transfer through a heat exchange by falling film. The objective of this study was to define the operating condition of the generator. Different falling film regimes were analyzed: drop mode, liquid column, and jet mode. The effective area of heat transfer of the two helical coils, wetting efficiency, and experimental film thickness were determined for the four operating flows (0.003, 0.008, 0.014, 0.019 kg/s) through digital image processing. The theoretical film thickness was measured and compared with the one calculated by the Nusselt equation. The flow of 0.008 kg/s maintained a drop mode distribution favoring a homogeneous fall along the helical test bank. A wetting efficiency of 99.52% was obtained, so it is proposed as operating flow in the generator. The theoretical film thickness for this flow was 0.289 cm and the one obtained experimentally through digital image processing was 0.293 cm. It was concluded that the distribution in the drop mode was more favorable for a better efficiency in the values of the falling film exchangers.

  14. Ultrasonic thickness structural health monitoring photoelastic visualization and measurement accuracy for internal pipe corrosion

    Science.gov (United States)

    Eason, Thomas J.; Bond, Leonard J.; Lozev, Mark G.

    2015-03-01

    Oil refinery production of fuels is becoming more challenging as a result of the changing world supply of crude oil towards properties of higher density, higher sulfur concentration, and higher acidity. One such production challenge is an increased risk of naphthenic acid corrosion that can result in various surface degradation profiles of uniform corrosion, non-uniform corrosion, and localized pitting in piping systems at temperatures between 150°C and 400°C. The irregular internal surface topology and high external surface temperature leads to a challenging in-service monitoring application for accurate pipe wall thickness measurements. Improved measurement technology is needed to continuously profile the local minimum thickness points of a non-uniformly corroding surface. The measurement accuracy and precision must be sufficient to provide a better understanding of the integrity risk associated with refining crude oils of higher acid concentration. This paper discusses potential technologies for measuring localized internal corrosion in high temperature steel piping and describes the approach under investigation to apply flexible ultrasonic thin-film piezoelectric transducer arrays fabricated by the sol-gel manufacturing process. Next, the elastic wave beam profile of a sol-gel transducer is characterized via photoelastic visualization. Finally, the variables that impact measurement accuracy and precision are discussed and a maximum likelihood statistical method is presented and demonstrated to quantify the measurement accuracy and precision of various time-of-flight thickness calculation methods in an ideal environment. The statistical method results in confidence values analogous to the a90 and a90/95 terminology used in Probability-of-Detection (POD) assessments.

  15. Fabrication and Properties of Bulk and Thick Film YTTRIUM(1) BARIUM(2) COPPER(3) OXYGEN(7-DELTA) Superconductors

    Science.gov (United States)

    Bailey, Andrew

    Many of the applications envisaged for the new high critical temperature cuprate superconductors require the ability to produce high quality material in layers of 1-100mum thickness which can be used as prepared, or after patterning into discrete forms. Among the possible applications in the foreseeable future are EMI/EMC shielding, pcb interconnects, inductances, stripline, mixers and resonators. Consequently it is important to establish methods of 'thick film' manufacture which provide the versatility necessary for the wide range of uses. During the course of this research, a variety of processing methods have been studied in an attempt to optimize the important film parameters of density, adhesion, strength and good stable superconducting characteristics. Details will be given of substrate-layer interaction for the various substrates that were studied, which included alumina, sapphire, single crystal (100)MgO and yttria stabilised zirconia together with a number of methods of substrate passivation. To date, the most successful substrate for Y_1Ba_2Cu_3O_{7-delta } thick film production has been yttria stabilised zirconia. This thesis will discuss the results of investigations, using yttria stabilised zirconia substrates, which have identified satisfactory means of obtaining superconducting layers with T_{c} = 91.5K and J_{c~ }3000 Acm^{-2} in zero applied magnetic field. At the time of writing, this value of critical current density remains the highest reported value for Y_1Ba_2Cu _3O_{7-delta} thick films. These high quality thick films were then used in a study of conduction mechanisms and the results are interpreted in terms of flux pinning and thermodynamic fluctuation theory. These results highlighted the complex nature of the conduction process in these new ceramics, which is dominated by the weak-link intergranular contacts. Finally, details are given of Josephson characteristics that were observed in variable thickness microbridges patterned into the

  16. Effects of TiO2 Film Thickness and Electrolyte Concentration on Photovoltaic Performance of Dye-Sensitized Solar Cell

    Science.gov (United States)

    Domtau, D. L.; Simiyu, J.; Ayieta, E. O.; Nyakiti, L. O.; Muthoka, B.; Mwabora, J. M.

    Effects of film thickness and electrolyte concentration on the photovoltaic performance of TiO2-based dye-sensitized solar cell (DSSC) were studied. Nanocrystalline anatase TiO2 thin films with varying thicknesses (3.2-18.9μm) have been deposited on FTO/glass substrates by screen printing method as work electrodes for DSSC. The prepared samples were characterized by UV-Vis spectroscopy, Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) and X-ray diffraction (XRD). The optimal thickness of the TiO2 photoanode is 13.5μm. Short-circuit photocurrent density (Jsc) increases with film thickness due to enlargement of surface area whereas open-circuit voltage decreases with increase in thickness due to increase in electron diffusion length to the electrode. However, the Jsc and Voc of DSSC with a film thickness of 18.9μm (7.5mA/cm2 and 0.687V) are smaller than those of DSSC with a TiO2 film thickness of 13.5μm (9.9mA/cm2 and 0.734V). This is because the increased thickness of TiO2 thin film resulted in the decrease in the transmittance of TiO2 thin films hence reducing the incident light intensity on the N719 dye. Photovoltaic performance also depends greatly on the redox couple concentration in iodide∖triiodide. Jsc decreases as the redox concentration increases as a result of increased viscosity of the solution which lowers ion mobility. Similarly, Voc decreases as the electrolyte concentration increases due to enhanced back electron transfer reaction. An optimum power conversion efficiency of 4.3% was obtained in a DSSC with the TiO2 film thickness of 13.5μm and redox concentration of 0.03mol dm-3 under AM 1.5G illumination at 100mW/cm2.

  17. Temperature dependent DC electrical conductivity studies of ZnO nanoparticle thick films prepared by simple solution combustion method

    Energy Technology Data Exchange (ETDEWEB)

    Naveen, C. S., E-mail: jayanna60@gmail.com; Jayanna, H. S., E-mail: jayanna60@gmail.com; Lamani, Ashok R., E-mail: jayanna60@gmail.com; Rajeeva, M. P., E-mail: jayanna60@gmail.com [Department of PG Studies and Research in Physics, Kuvempu University, Shankaraghatta- 577451, Shimoga, Karnataka (India)

    2014-04-24

    ZnO nanoparticles of different size were prepared by varying the molar ratio of glycine and zinc nitrate hexahydrate as fuel and oxidizer (F/O = 0.8, 1.11, 1.7) by simple solution combustion method. Powder samples were characterized by UV-Visible spectrophotometer, X-ray diffractometer, Scanning electron microscope (SEM). DC electrical conductivity measurements at room temperature and in the temperature range of 313-673K were carried out for the prepared thick films and it was found to increase with increase of temperature which confirms the semiconducting nature of the samples. Activation energies were calculated and it was found that, F/O molar ratio 1.7 has low E{sub AL} (Low temperature activation energy) and high E{sub AH} (High temperature activation energy) compared to other samples.

  18. Detection of liquid petroleum gas using mixed nanosized tungsten oxide-based thick-film semiconductor sensor.

    Science.gov (United States)

    Chaudhari, G N; Bende, A M; Bodade, A B; Patil, S S; Manorama, S V

    2006-03-15

    The thick-film semiconductor sensor for liquid petroleum gas (LPG) detection was fabricated using a mixed WO(3)-based sensor. We present the characterization of both their structural properties by means of XRD measurements and the electrical characteristics by using gas-sensing properties. The sensing characteristics such as sensitivity, working range, cross-sensitivity and response time were studied by using nanosized WO(3)-based mixed with different metal oxides (SnO(2), TiO(2) and In(2)O(3)) and doped with noble metals (Au, Pd and Pt). The WO(3)-based mixed with 5 wt.% In(2)O(3) and 0.5 wt.% Pd showed the higher sensing characteristic at low concentration of LPG sensor at an operating temperature 225 degrees C.

  19. Fabrication and characterization of MEMS-based PZT/PZT bimorph thick film vibration energy harvesters

    DEFF Research Database (Denmark)

    Xu, Ruichao; Lei, Anders; Dahl-Petersen, Christian

    2012-01-01

    We describe the fabrication and characterization of a significantly improved version of a microelectromechanical system-based PZT/PZT thick film bimorph vibration energy harvester with an integrated silicon proof mass; the harvester is fabricated in a fully monolithic process. The main advantage...... of bimorph vibration energy harvesters is that strain energy is not lost in mechanical support materials since only Pb(ZrxTi1-x)O3 (PZT) is strained; as a result, the effective system coupling coefficient is increased, and thus a potential for significantly higher output power is released. In addition, when...... the two layers are connected in series, the output voltage is increased, and as a result the relative power loss in the necessary rectifying circuit is reduced. We describe an improved process scheme for the energy harvester, which resulted in a robust fabrication process with a record high fabrication...

  20. Piezoelectric and Magnetoelectric Thick Films for Fabricating Power Sources in Wireless Sensor Nodes

    Directory of Open Access Journals (Sweden)

    Jong-Jin Choi

    2009-08-01

    Full Text Available In this manuscript, we review the progress made in the synthesis of thick film-based piezoelectric and magnetoelectric structures for harvesting energy from mechanical vibrations and magnetic field. Piezoelectric compositions in the system Pb(Zr,TiO3–Pb(Zn1/3Nb2/3O3 (PZNT have shown promise for providing enhanced efficiency due to higher energy density and thus form the base of transducers designed for capturing the mechanical energy. Laminate structures of PZNT with magnetostrictive ferrite materials provide large magnitudes of magnetoelectric coupling and are being targeted to capture the stray magnetic field energy. We analyze the models used to predict the performance of the energy harvesters and present a full system description.

  1. Micro-particle manipulation by single beam acoustic tweezers based on hydrothermal PZT thick film

    International Nuclear Information System (INIS)

    Zhu, Benpeng; Xu, Jiong; Yang, Xiaofei; Li, Ying; Lee, Changyang; Zhou, Qifa; Shung, K. Kirk; Wang, Tian; Xiong, Ke; Shiiba, Michihisa; Takeuchi, Shinichi

    2016-01-01

    Single-beam acoustic tweezers (SBAT), used in laboratory-on-a-chip (LOC) device has promising implications for an individual micro-particle contactless manipulation. In this study, a freestanding hydrothermal PZT thick film with excellent piezoelectric property (d 33 = 270 pC/N and k t = 0.51) was employed for SBAT applications and a press-focusing technology was introduced. The obtained SBAT, acting at an operational frequency of 50 MHz, a low f-number (∼0.9), demonstrated the capability to trap and manipulate a micro-particle sized 10μm in the distilled water. These results suggest that such a device has great potential as a manipulator for a wide range of biomedical and chemical science applications.

  2. Design guidelines for advanced LSI microcircuit packaging using thick film multilayer technology

    Science.gov (United States)

    Peckinpaugh, C. J.

    1974-01-01

    Ceramic multilayer circuitry results from the sequential build-up of two or more layers of pre-determined conductive interconnections separated by dielectric layers and fired at an elevated temperature to form a solidly fused structure. The resultant ceramic interconnect matrix is used as a base to mount active and passive devices and provide the necessary electrical interconnection to accomplish the desired electrical circuit. Many methods are known for developing multilevel conductor mechanisms such as multilayer printed circuits, welded wire matrices, flexible copper tape conductors, and thin and thick-film ceramic multilayers. Each method can be considered as a specialized field with each possessing its own particular set of benefits and problems. This design guide restricts itself to the art of design, fabrication and assembly of ceramic multilayer circuitry and the reliability of the end product.

  3. Generation of Bessel Surface Plasmon Polaritons in a Finite-Thickness Metal Film

    Directory of Open Access Journals (Sweden)

    S. N. Kurilkina

    2013-01-01

    Full Text Available A theory of generation of low- and high-index Bessel surface plasmon polaritons and their superposition in a metal film of a finite thickness is developed. Correct analytical expressions are obtained for the field of two families of Bessel surface plasmon polariton modes formed inside and outside the metal layer. The intensity distribution near the boundary of the layer has been calculated and analyzed. A scheme for the experimental realization of a superposition of Bessel surface plasmon polaritons is suggested. Our study demonstrates that it is feasible to use the superposition of Bessel surface plasmon polaritons as a virtual tip for near-field optical microscopy with a nanoscale resolution.

  4. Coexistence of several structural phases in MOCVD TiO{sub 2} layers: evolution from nanometre to micrometre thick films

    Energy Technology Data Exchange (ETDEWEB)

    Brevet, A; Marco de Lucas, M C; Potin, V; Chassagnon, R; Imhoff, L; Domenichini, B; Bourgeois, S, E-mail: delucas@u-bourgogne.f [Institut Carnot de Bourgogne, UMR 5209 CNRS-Universite de Bourgogne, 9 Av. A. Savary, BP 47 870, F-21078 DIJON Cedex (France)

    2009-09-07

    The morphology and the structure of TiO{sub 2} films, grown on Si (1 0 0) substrates by metal organic chemical vapour deposition (MOCVD) was investigated in 5-500 nm thick films. It was shown that the TiO{sub 2} layer is mainly amorphous at the first stages of deposition. The growth of nanocrystallites begins inside the amorphous TiO{sub 2} layer, and it continues at the expense of the amorphous phase until the crystallized grains occupy the whole layer. Then, the film growth continues with a columnar structure. The coexistence of anatase and rutile phases was evidenced from the beginning of the growth by high resolution transmission electron microscopy and grazing incidence x-ray diffraction. However, the anatase growth overcomes that of rutile, leading to an inhomogeneous phase distribution as a function of the film thickness.

  5. In vitro analysis of the cement film thickness of two endodontic sealers in the apical region

    Directory of Open Access Journals (Sweden)

    Garcia Lucas da Fonseca

    2009-01-01

    Full Text Available Objectives : The objective of the present study was to evaluate in vitro film thickness of two endodontic sealers containing epoxy-resin and zinc-oxide-eugenol, respectively in the apical region of the root canal system. Materials and Methods : A total of 20 palatine roots of the first maxillary molars were submitted to instrumentation up to a #40 file by the step-back technique and irrigated with 2 ml of NaOCl after each change of file. The roots were divided at random into two groups of 10 elements; one group was sealed with the Sealer 26® cement and the other one with the EndoFill® cement using the classical technique. The roots were abraded in the apical region until exposure of the filling and cut crosswise at 3 mm to obtain samples. The samples were analyzed by optic microscopy with 40X magnification. The images obtained were recorded using the Adobe Premiere 5.1® software and submitted to morphometric analysis using an integration grid that permitted the quantification of the area filled with the sealer or gutta-percha, and eventual empty spaces. Results : Statistical analysis of the data (Kruskal-Wallis test, P < 0.05 revealed no significant differences between the epoxy-resin-based cement Sealer 26® (47.85% and the zinc- oxide- eugenol-based cement EndoFill® (54.16%. Conclusion : We conclude that the two sealers tested showed a similar behavior regarding the cement film thickness in the apical region.

  6. Properties of PZT thick film made on LTCC substrates with dielectric intermediate layers

    Science.gov (United States)

    DÄ browski, Arkadiusz; Golonka, Leszek

    2016-11-01

    Results of experiments on application of various interlayers between LTCC (Low Temperature Cofired Ceramics) substrate and thick-film PZT (Lead Zirconate - Titanate) are described in this work. Thick-film intermediate layers were based on several dielectric materials: TiN, Al2O3, SiC, TiO2, SiC, YSZ, BN. Seven screen printable pastes were prepared on the base of powders of mentioned materials with addition of glass and organic vehicle. The substrates were made of 951 (DuPont), CeramTapeGC (CeramTec) and HL2000 (Heraeus) LTCC tapes. Sandwich type transducers, consisting of barrier layer, gold bottom electrode, PZT layer and silver top electrode were prepared and characterized. Basic piezoelectric parameters - permittivity, effective charge constant (d33(eff)) and remanent polarization were determined. The best properties were obtained for substrates made of 951. In general, interlayers based on TiO2, SiC and Al2O3 improved permittivity and charge constant comparing to bare substrates. For example, for 951 substrate the PZT layer exhibited d33(eff) equal to 160, 215, 250 and 230 pC/N for bare substrate, TiO2 interlayer, SiC interlayer and Al2O3 interlayer, respectively. In case of CeramTape GC substrates determined permittivity was equal to 215, 245, 235 and 275 for bare substrate, TiO2 interlayer, SiC interlayer and Al2O3 interlayer, respectively. In case of TiN and BN materials the parameters were considerably deteriorated.

  7. An Ion-selective Electrode for Anion Perchlorate in Thick-film Technology

    Directory of Open Access Journals (Sweden)

    Luís Gil

    2006-04-01

    Full Text Available The ionophore 1,4,7,10,13-penta(n-octyl-1,4,7,10,13-pentaazacyclopentadecane(L1 was used for the development of miniaturised perchlorate-selective electrodes in thick-film technology. Different PVC membranes containing L1 and the plasticizers o-nitrophenyloctyl ether (NPOE, dibutyl phthalate (DBP, bis(2-ethylhexylsebacate (DOS and dibutylsebacate (DBS were prepared and placed on a graphite working electrode manufactured byusing thick film serigraphic technology. The perchlorate selective electrode containing DBSas plasticizer showed a potentiometric Nernstian response of -57 mV per decade in a rangeof perchlorate concentration from 1 x 10-4 to 1 x 10-1 M with a detection limit of 5 x 10-5 M.The ion selective electrodes containing DBP and NPOE as plasticizers exhibit a workingrange from 6.3 x 10-5 to 1 x 10-1 M and 7.4 x 10-5 to 1 x 10-1 M for perchlorate, respectively,with a detection limit of ca. 2.2 x 10-5 M. For all three electrodes a response time of ca. 5 s was found. The prepared electrodes do not show appreciable decay of the slope for at least 25 days. Potentiometric selectivity coefficients (log KpotClO4-,X- with respect to the primaryanion perchlorate were evaluated using the fixed interference method. These coefficients areof the order of 10-1.7 or smaller, indicating the relatively poor interference of the differentanions studied.

  8. Enhanced sensitivity to dielectric function and thickness of absorbing thin films by combining total internal reflection ellipsometry with standard ellipsometry and reflectometry

    International Nuclear Information System (INIS)

    Lizana, A; Foldyna, M; Garcia-Caurel, E; Stchakovsky, M; Georges, B; Nicolas, D

    2013-01-01

    High sensitivity of spectroscopic ellipsometry and reflectometry for the characterization of thin films can strongly decrease when layers, typically metals, absorb a significant fraction of the light. In this paper, we propose a solution to overcome this drawback using total internal reflection ellipsometry (TIRE) and exciting a surface longitudinal wave: a plasmon-polariton. As in the attenuated total reflectance technique, TIRE exploits a minimum in the intensity of reflected transversal magnetic (TM) polarized light and enhances the sensitivity of standard methods to thicknesses of absorbing films. Samples under study were stacks of three films, ZnO : Al/Ag/ZnO : Al, deposited on glass substrates. The thickness of the silver layer varied from sample to sample. We performed measurements with a UV–visible phase-modulated ellipsometer, an IR Mueller ellipsometer and a UV–NIR reflectometer. We used the variance–covariance formalism to evaluate the sensitivity of the ellipsometric data to different parameters of the optical model. Results have shown that using TIRE doubled the sensitivity to the silver layer thickness when compared with the standard ellipsometry. Moreover, the thickness of the ZnO : Al layer below the silver layer can be reliably quantified, unlike for the fit of the standard ellipsometry data, which is limited by the absorption of the silver layer. (paper)

  9. TiN films by Atomic Layer Deposition: Growth and electrical characterization down to sub-nm thickness

    NARCIS (Netherlands)

    Van Hao, B.; Wolters, Robertus A.M.; Kovalgin, Alexeij Y.

    2012-01-01

    This study reports on the growth and characterization of TiN thib films obtained by atomic layer deposition at 350-425 ◦C. We observe a growth of the continuous layers from the very beginning of the process, i.e. for a thickness of 0.65 nm, which is equivalent to 3 monolayers of TiN. The film growth

  10. Capability of Sputtered Micro-patterned NiTi Thick Films

    Science.gov (United States)

    Bechtold, Christoph; Lima de Miranda, Rodrigo; Quandt, Eckhard

    2015-09-01

    Today, most NiTi devices are manufactured by a combination of conventional metal fabrication steps, e.g., melting, extrusion, cold working, etc., and are subsequently structured by high accuracy laser cutting. This combination has been proven to be very successful; however, there are several limitations to this fabrication route, e.g., in respect to the fabrication of more complex device designs, device miniaturization or the combination of different materials for the integration of further functionality. These issues have to be addressed in order to develop new devices and applications. The fabrication of micro-patterned films using magnetron sputtering, UV lithography, and wet etching has great potential to overcome limitations of conventional device manufacturing. Due to its fabrication characteristics, this method allows the production of devices with complex designs, high structural accuracy, smooth edge profile, at layer thicknesses up to 75 µm. The aim of this study is to present recent developments in the field of NiTi thin film technology, its advantages and limitations, as well as new possible applications in the medical and in non-medical fields. These developments include among others NiTi scaffold structures covered with NiTi membranes for their potential use as filters, heart valve components or aneurysm treatments, as well as micro-actuators for consumable electronics or automotive applications.

  11. Dependence of the conductivity on the active-region thickness in GaAs thin-film Schottky diodes

    Energy Technology Data Exchange (ETDEWEB)

    Zuev, S. A., E-mail: sazuev@yandex.ru; Kilessa, G. V.; Asanov, E. E.; Starostenko, V. V.; Pokrova, S. V. [Vernadsky Crimean Federal University (Russian Federation)

    2016-06-15

    The dependences of the electrical characteristics of thin-film structures with Schottky barrier on gallium arsenide are studied using Monte Carlo numerical simulation in the kinetic approximation with the main scattering mechanisms taken into account. The dependences of the diode conductivity on the voltage and channel thickness are obtained. It is shown that the relation between the diode voltage and conductivity changes at a small channel thickness, which is explained by barrier field expulsion to the substrate.

  12. Thickness dependence of optical parameters for ZnTe thin films deposited by electron beam gun evaporation technique

    International Nuclear Information System (INIS)

    Salem, A.M.; Dahy, T.M.; El-Gendy, Y.A.

    2008-01-01

    Zinc telluride thin films with different thicknesses have been deposited by electron beam gun evaporation system onto glass substrates at room temperature. X-ray and electron diffraction techniques have been employed to determine the crystal structure and the particle size of the deposited films. The stoichiometry of the deposited films was confirmed by means of energy-dispersive X-ray spectrometry. The optical transmission and reflection spectrum of the deposited films have been recorded in the wavelength optical range 450-2500 nm. The variation of the optical parameters, i.e. refractive index, n, extinction coefficient, k, with thickness of the deposited films has been investigated. The refractive index dispersion in the transmission and low absorption region is adequately described by the single-oscillator model, whereby the values of the oscillator strength, oscillator position, dispersion parameter as well as the high-frequency dielectric constant were calculated for different film thickness. Graphical representations of the surface and volume energy loss function were also presented

  13. Thickness-dependent coherent phonon frequency in ultrathin FeSe/SrTiO3 films

    Energy Technology Data Exchange (ETDEWEB)

    Yang, Shuolong [SLAC National Accelerator Lab., Menlo Park, CA (United States); Stanford Univ., Stanford, CA (United States); Sobota, Jonathan A. [SLAC National Accelerator Lab., Menlo Park, CA (United States); Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Leuenberger, Dominik [SLAC National Accelerator Lab., Menlo Park, CA (United States); Stanford Univ., Stanford, CA (United States); Kemper, Alexander F. [Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Lee, James J. [SLAC National Accelerator Lab., Menlo Park, CA (United States); Stanford Univ., Stanford, CA (United States); Schmitt, Felix T. [SLAC National Accelerator Lab., Menlo Park, CA (United States); Stanford Univ., Stanford, CA (United States); Li, Wei [SLAC National Accelerator Lab., Menlo Park, CA (United States); Stanford Univ., Stanford, CA (United States); Moore, Rob G. [SLAC National Accelerator Lab., Menlo Park, CA (United States); Stanford Univ., Stanford, CA (United States); Kirchmann, Patrick S. [SLAC National Accelerator Lab., Menlo Park, CA (United States); Shen, Zhi -Xun [SLAC National Accelerator Lab., Menlo Park, CA (United States); Stanford Univ., Stanford, CA (United States)

    2015-06-01

    Ultrathin FeSe films grown on SrTiO3 substrates are a recent milestone in atomic material engineering due to their important role in understanding unconventional superconductivity in Fe-based materials. By using femtosecond time- and angle-resolved photoelectron spectroscopy, we study phonon frequencies in ultrathin FeSe/SrTiO3 films grown by molecular beam epitaxy. After optical excitation, we observe periodic modulations of the photoelectron spectrum as a function of pump–probe delay for 1-unit-cell, 3-unit-cell, and 60-unit-cell thick FeSe films. The frequencies of the coherent intensity oscillations increase from 5.00 ± 0.02 to 5.25 ± 0.02 THz with increasing film thickness. By comparing with previous works, we attribute this mode to the Se A1g phonon. The dominant mechanism for the phonon softening in 1-unit-cell thick FeSe films is a substrate-induced lattice strain. Results demonstrate an abrupt phonon renormalization due to a lattice mismatch between the ultrathin film and the substrate.

  14. A method to investigate the electron scattering characteristics of ultrathin metallic films by in situ electrical resistance measurements

    Energy Technology Data Exchange (ETDEWEB)

    Trindade, I. G.; Sousa, J. B. [IFIMUP and IN, Rua do campo Alegre, 687, 4169-007 Porto (Portugal); Department of Physics, FCUP, Rua do Campo Alegre, 687, 4169-007 Porto (Portugal); Fermento, R. [Instituto de Microelectronica de Madrid, Isaac Newton 8, 28760 Tres Cantos, Madrid (Spain); Leitao, D. [IFIMUP and IN, Rua do campo Alegre, 687, 4169-007 Porto (Portugal)

    2009-07-15

    In this article, a method to measure the electrical resistivity/conductivity of metallic thin films during layer growth on specific underlayers is described. The in situ monitoring of an underlayer electrical resistance, its change upon the incoming of new material atoms/molecules, and the growth of a new layer are presented. The method is easy to implement and allows obtaining in situ experimental curves of electrical resistivity dependence upon film thickness with a subatomic resolution, providing insight in film growth microstructure characteristics, specular/diffuse electron scattering surfaces, and optimum film thicknesses.

  15. Carotid intima-media thickness measurement in cardiovascular screening programmes.

    Science.gov (United States)

    Plantinga, Yvonne; Dogan, Soner; Grobbee, Diederick E; Bots, Michiel L

    2009-12-01

    Support for the notion that a carotid intima-media thickness (CIMT) measurement is useful in individual cardiovascular risk prediction in addition to a risk function may come from studies showing that for an individual a high or low CIMT measurement leads to a correct shift from one to another risk category and this shift is followed by different treatment consequences. We set out to systematically review the published evidence by performing a PubMed search (2 March 2009). Out of 50 publications on CIMT and future events, 31 reported on the relation in the correct domain, [i.e. those free from symptomatic vascular disease or diabetes mellitus in which assessment of risk using a risk function (e.g. Framingham or SCORE) to base initiation of drug treatment upon is recommended]. Most studies reported relative risks (or equivalents) for the entire population only, and no information on relative risks within certain risk categories that may be of use to reclassify individuals based on combination of absolute and relative risks. No data on potential shifts of participants was presented. Eight studies specifically focused on the added value of CIMT in risk prediction. In seven studies the area under the curve (AUC) of a receiver operating characteristic was used to assess improvements in risk prediction. These analyses showed that addition of a CIMT measurement to established risk factors led to small and sometimes significant improvements in the AUC. However, change in AUC should not be the only parameter to rely on to judge the appropriateness of CIMT in risk stratification. In one study (n = 242), evidence was presented in participants with an intermediate Framingham risk score, a CIMT measurement above the 60th (men) and 80th (women) percentile of age-specific normal CIMT values, shifted participants above the threshold for initiation of drug therapy. Yet, the study was based on 24 events, and no information was presented on the proportion of participants correctly

  16. PEDOT(PSS) as Solid Contact for Ion-Selective Electrodes: The Influence of the PEDOT(PSS) Film Thickness on the Equilibration Times.

    Science.gov (United States)

    Guzinski, Marcin; Jarvis, Jennifer M; Perez, Felio; Pendley, Bradford D; Lindner, Ernő; De Marco, Roland; Crespo, Gaston A; Acres, Robert G; Walker, Raymart; Bishop, Josiah

    2017-03-21

    To understand the rate determining processes during the equilibration of poly(3,4-ethylenedioxythiophene):polystyrenesulfonate-based (PEDOT(PSS)-based) solid contact (SC) ion-selective electrodes (ISEs), the surfaces of Pt, Au, and GC electrodes were coated with 0.1, 1.0, 2.0, and 4.0 μm thick galvanostatically deposited PEDOT(PSS) films. Next, potential vs time transients were recorded with these electrodes, with and without an additional potassium ion-selective membrane (ISM) coating, following their first contact with 0.1 M KCl solutions. The transients were significantly different when the multilayered sensor structures were assembled on Au or GC compared to Pt. The differences in the rate of equilibration were interpreted as a consequence of differences in the hydrophilicity of PEDOT(PSS) in contact with the substrate electrode surfaces based on X-ray photoelectron spectroscopy (XPS) and synchrotron radiation-XPS (SR-XPS) analysis of 10-100 nm thick PEDOT(PSS) films. The influence of the layer thickness of the electrochemically deposited PEDOT(PSS)-films on the hydrophilicity of these films has been documented by contact angle measurements over PEDOT(PSS)-coated Au, GC, and Pt electrode surfaces. This study demonstrates that it is possible to minimize the equilibration (conditioning) time of SC ISEs with aqueous solutions before usage by optimizing the thickness of the SC layer with a controlled ISM thickness. PEDOT(PSS)-coated Au and GC electrodes exhibit a significant negative potential drift during their equilibration in an aqueous solution. By coating the PEDOT(PSS) surface with an ISM, the negative potential drift is compensated by a positive potential drift related to the hydration of the ISM and activity changes at the PEDOT(PSS)|ISM interface. The potential drifts related to activity changes in the ISM have been determined by a novel adaptation of the "sandwich membrane" method.

  17. Controlling dielectric and relaxor-ferroelectric properties for energy storage by tuning Pb0.92La0.08Zr0.52Ti0.48O3 film thickness.

    Science.gov (United States)

    Brown, Emery; Ma, Chunrui; Acharya, Jagaran; Ma, Beihai; Wu, Judy; Li, Jun

    2014-12-24

    The energy storage properties of Pb0.92La0.08Zr0.52Ti0.48O3 (PLZT) films grown via pulsed laser deposition were evaluated at variable film thickness of 125, 250, 500, and 1000 nm. These films show high dielectric permittivity up to ∼1200. Cyclic I-V measurements were used to evaluate the dielectric properties of these thin films, which not only provide the total electric displacement, but also separate contributions from each of the relevant components including electric conductivity (D1), dielectric capacitance (D2), and relaxor-ferroelectric domain switching polarization (P). The results show that, as the film thickness increases, the material transits from a linear dielectric to nonlinear relaxor-ferroelectric. While the energy storage per volume increases with the film thickness, the energy storage efficiency drops from ∼80% to ∼30%. The PLZT films can be optimized for different energy storage applications by tuning the film thickness to optimize between the linear and nonlinear dielectric properties and energy storage efficiency.

  18. Enhanced Self-Biased Magnetoelectric Coupling in Laser-Annealed Pb(Zr,Ti)O3Thick Film Deposited on Ni Foil.

    Science.gov (United States)

    Palneedi, Haribabu; Maurya, Deepam; Geng, Liwei D; Song, Hyun-Cheol; Hwang, Geon-Tae; Peddigari, Mahesh; Annapureddy, Venkateswarlu; Song, Kyung; Oh, Yoon Seok; Yang, Su-Chul; Wang, Yu U; Priya, Shashank; Ryu, Jungho

    2018-01-19

    Enhanced and self-biased magnetoelectric (ME) coupling is demonstrated in a laminate heterostructure comprising 4 μm-thick Pb(Zr,Ti)O 3 (PZT) film deposited on 50 μm-thick flexible nickel (Ni) foil. A unique fabrication approach, combining room temperature deposition of PZT film by granule spray in vacuum (GSV) process and localized thermal treatment of the film by laser radiation, is utilized. This approach addresses the challenges in integrating ceramic films on metal substrates, which is often limited by the interfacial chemical reactions occurring at high processing temperatures. Laser-induced crystallinity improvement in the PZT thick film led to enhanced dielectric, ferroelectric, and magnetoelectric properties of the PZT/Ni composite. A high self-biased ME response on the order of 3.15 V/cm·Oe was obtained from the laser-annealed PZT/Ni film heterostructure. This value corresponds to a ∼2000% increment from the ME response (0.16 V/cm·Oe) measured from the as-deposited PZT/Ni sample. This result is also one of the highest reported values among similar ME composite systems. The tunability of self-biased ME coupling in PZT/Ni composite has been found to be related to the demagnetization field in Ni, strain mismatch between PZT and Ni, and flexural moment of the laminate structure. The phase-field model provides quantitative insight into these factors and illustrates their contributions toward the observed self-biased ME response. The results present a viable pathway toward designing and integrating ME components for a new generation of miniaturized tunable electronic devices.

  19. Rational Design of QCM-D Virtual Sensor Arrays Based on Film Thickness, Viscoelasticity, and Harmonics for Vapor Discrimination.

    Science.gov (United States)

    Speller, Nicholas C; Siraj, Noureen; Regmi, Bishnu P; Marzoughi, Hassan; Neal, Courtney; Warner, Isiah M

    2015-01-01

    Herein, we demonstrate an alternative strategy for creating QCM-based sensor arrays by use of a single sensor to provide multiple responses per analyte. The sensor, which simulates a virtual sensor array (VSA), was developed by depositing a thin film of ionic liquid, either 1-octyl-3-methylimidazolium bromide ([OMIm][Br]) or 1-octyl-3-methylimidazolium thiocyanate ([OMIm][SCN]), onto the surface of a QCM-D transducer. The sensor was exposed to 18 different organic vapors (alcohols, hydrocarbons, chlorohydrocarbons, nitriles) belonging to the same or different homologous series. The resulting frequency shifts (Δf) were measured at multiple harmonics and evaluated using principal component analysis (PCA) and discriminant analysis (DA) which revealed that analytes can be classified with extremely high accuracy. In almost all cases, the accuracy for identification of a member of the same class, that is, intraclass discrimination, was 100% as determined by use of quadratic discriminant analysis (QDA). Impressively, some VSAs allowed classification of all 18 analytes tested with nearly 100% accuracy. Such results underscore the importance of utilizing lesser exploited properties that influence signal transduction. Overall, these results demonstrate excellent potential of the virtual sensor array strategy for detection and discrimination of vapor phase analytes utilizing the QCM. To the best of our knowledge, this is the first report on QCM VSAs, as well as an experimental sensor array, that is based primarily on viscoelasticity, film thickness, and harmonics.

  20. Free radially expanding liquid sheet in air: time- and space-resolved measurement of the thickness field

    Science.gov (United States)

    Ligoure, Christian; Vernay, Clara; Ramos, Laurence

    2014-11-01

    The collision of a liquid drop against a small target results in the formation of a thin liquid sheet that extends radially until it reaches a maximum diameter. We have developed an original time- and space-resolved technique to measure the thickness field of this class of liquid sheet, based on the grey level measurement of the image of a dyed liquid sheet recorded using a fast camera. This method enables a precise measurement of the thickness in the range (10--450) μm, with a temporal resolution equals to that of the camera. Two asymptotic regimes for the expansion of the sheet are evidenced. The scalings of the thickness with t and r measured in the two regimes are those that were predicted but never experimentally measured before. Interestingly, our experimental data also evidence the existence of a maximum of the film thickness hmax (r) at a radial position rhmax (t) corresponding to the crossover of these two asymptotic regimes. The maximum moves with a constant velocity of the order of the impact velocity, Hence, our data has allowed one to reconcile the two apparently inconsistent theoretical predictions found in the literature Thanks to our visualization technique, we also evidence an azimuthal thickness modulation. Financial support from Solvay is acknowledged.

  1. Influence of artificial pinning centers on structural and superconducting properties of thick YBCO films on ABAD-YSZ templates

    Science.gov (United States)

    Pahlke, Patrick; Sieger, Max; Ottolinger, Rick; Lao, Mayraluna; Eisterer, Michael; Meledin, Alexander; Van Tendeloo, Gustaaf; Hänisch, Jens; Holzapfel, Bernhard; Schultz, Ludwig; Nielsch, Kornelius; Hühne, Ruben

    2018-04-01

    Recent efforts in the development of YBa2Cu3O7-x (YBCO) coated conductors are devoted to the increase of the critical current I c in magnetic fields. This is typically realized by growing thicker YBCO layers as well as by the incorporation of artificial pinning centers. We studied the growth of doped YBCO layers with a thickness of up to 7 μm using pulsed laser deposition with a growth rate of about 1.2 nm s-1. Industrially fabricated ion-beam textured YSZ templates based on metal tapes were used as substrates for this study. The incorporation of BaHfO3 (BHO) or Ba2Y(Nb0.5Ta0.5)O6 (BYNTO) secondary phase additions leads to a denser microstructure compared to undoped films. A purely c-axis-oriented YBCO growth is preserved up to a thickness of about 4 μm, whereas misoriented texture components were observed in thicker films. The critical temperature is slightly reduced compared to undoped films and independent of film thickness. The critical current density J c of the BHO- and BYNTO-doped YBCO layers is lower at 77 K and self-field compared to pure YBCO layers; however, I c increases up to a thickness of 5 μm. A comparison between films with a thickness of 1.3 μm revealed that the anisotropy of the critical current density J c(θ) strongly depends on the incorporated pinning centers. Whereas BHO nanorods lead to a strong B∣∣c-axis peak, the overall anisotropy is significantly reduced by the incorporation of BYNTO forming a mixture of short c-axis-oriented nanorods and small (a-b)-oriented platelets. As a result, the J c values of the doped films outperform the undoped samples at higher fields and lower temperatures for most magnetic field directions.

  2. Thickness dependence of the quantum Hall effect in films of the three-dimensional Dirac semimetal Cd3As2

    Directory of Open Access Journals (Sweden)

    Manik Goyal

    2018-02-01

    Full Text Available Low-temperature magnetotransport studies are reported for (112Cd3As2 films grown on (111CdTe by molecular beam epitaxy as a function of the Cd3As2 film thickness. All films show Shubnikov-de Haas oscillations. An even-integer quantum Hall effect is observed for films thinner than 70 nm. For the thinnest films, the bulk is gapped and transport at low temperatures occurs only via the gapless, two-dimensional states. The lowest Landau level is reached at ∼10 T, and the longitudinal resistance nearly vanishes at the plateaus in the Hall resistance. The results are discussed in the context of the current theoretical understanding of topological surface states in three-dimensional Dirac semimetals.

  3. Structure and piezoelectric properties of 1-μm-thick polar-axis-oriented CaBi4Ti4O15 films

    Science.gov (United States)

    Kato, K.; Tanaka, K.; Kayukawa, S.; Suzuki, K.; Masuda, Y.; Kimura, T.; Nishizawa, K.; Miki, T.

    2007-06-01

    1-μm-thick polar-axis-oriented CaBi4Ti4O15 (CBTi144) films were fabricated by control of nucleation and growth in alkoxy-derived non-crystalline layers on Pt foils. The oxygen ambient during pre-baking impacted both the cross-sectional microstructure and the crystallographic orientation. The 1-μm-thick film showed relatively high intensities of (100)/(010) diffraction lines in the X-ray diffraction profile and simultaneously had a closely packed dense structure in the transmission electron microscopy cross-sectional profile. Resultantly, the leakage current density decreased to about 7×10-8 A/cm2 at 10 V. The piezoelectric constant d33 was determined to be 260 pm/V at a maximum poling voltage of 60 V by measurements using piezoelectric force microscopy.

  4. Microfabricated Thin Film Impedance Sensor & AC Impedance Measurements

    Science.gov (United States)

    Yu, Jinsong; Liu, Chung-Chiun

    2010-01-01

    Thin film microfabrication technique was employed to fabricate a platinum based parallel-electrode structured impedance sensor. Electrochemical impedance spectroscopy (EIS) and equivalent circuit analysis of the small amplitude (±5 mV) AC impedance measurements (frequency range: 1 MHz to 0.1 Hz) at ambient temperature were carried out. Testing media include 0.001 M, 0.01 M, 0.1 M NaCl and KCl solutions, and alumina (∼3 μm) and sand (∼300 μm) particulate layers saturated with NaCl solutions with the thicknesses ranging from 0.6 mm to 8 mm in a testing cell, and the results were used to assess the effect of the thickness of the particulate layer on the conductivity of the testing solution. The calculated resistances were approximately around 20 MΩ, 4 MΩ, and 0.5 MΩ for 0.001 M, 0.01 M, and 0.1 M NaCl solutions, respectively. The presence of the sand particulates increased the impedance dramatically (6 times and 3 times for 0.001 M and 0.1 M NaCl solutions, respectively). A cell constant methodology was also developed to assess the measurement of the bulk conductivity of the electrolyte solution. The cell constant ranged from 1.2 to 0.8 and it decreased with the increase of the solution thickness. PMID:22219690

  5. Structure and electrical properties of Na0.5Bi0.5TiO3 ferroelectric thick films derived from a polymer modified sol-gel method.

    Science.gov (United States)

    Ji, Hongfen; Ren, Wei; Wang, Lingyan; Shi, Peng; Chen, Xiaofeng; Wu, Xiaoqing; Yao, Xi; Lau, Sien-Ting; Zhou, Qifa; Shung, K Kirk

    2011-10-01

    Lead-free NaBi(0.5)TiO(3) (NBT) ferroelectric thick films were prepared by a poly(vinylpyrrolidone) (PVP) modified sol-gel method. The NBT thick films annealed from 500°C to 750°C exhibit a perovskite structure. The relationship between annealing temperature, thickness, and electrical properties of the thick films has been investigated. The dielectric constants and remnant polarizations of the thick films increase with annealing temperature. The electrical properties of the NBT films show strong thickness dependence. As thickness increases from 1.0 to 4.8 μm, the dielectric constant of the NBT films increases from 620 to 848, whereas the dielectric loss is nearly independent of the thickness. The remnant polarization of the NBT thick films also increases with increasing thickness. The leakage current density first decreases and then increases with film thickness.

  6. Thickness dependence of the conductivity of thin films (La,Sr)FeO3 deposited on MgO single crystal

    International Nuclear Information System (INIS)

    Mosleh, Majid; Pryds, Nini; Hendriksen, Peter Vang

    2007-01-01

    Thin films of La 0.6 Sr 0.4 FeO 3-δ of different thicknesses have been deposited on single crystal MgO substrate by pulsed laser deposition (PLD). The deposited films are characterized by XRD before and after annealing, by scanning electron microscopy (SEM) for morphological characterization and by the Van der Pauw (VDP) technique for determination of the conductivity. The temperature dependence of the conductivity in air for samples of different thickness has been investigated. The electrical conductivity of the films increases with increasing film thickness but the conductivity of all films is less than the value of the bulk material. The apparent conductivity versus temperature shows a maximum at a certain temperature (T max ). This characteristic temperature (T max ) decreases as the film thickness increases and reaches the value for bulk for thicker films. All of the samples show the same activation energy of the conductivity in the low temperature limit

  7. Mass thickness measurement of dual-sample by dual-energy X-rays

    International Nuclear Information System (INIS)

    Chen Mincong; Li Hongmei; Chen Ziyu; Shen Ji

    2008-01-01

    X-ray equivalent energy can be used to measure mass thicknesses of materials. Based on this, a method of mass thickness measurement of dual-sample was discussed. It was found that in the range of sample mass thickness under investigation, the equivalent mass attenuation coefficient of a component could be used to compute mass thicknesses of a dual-sample, with relative errors of less than 5%. Mass thickness measurement of a fish sample was performed, and the fish bone and flesh could be displayed separately and clearly by their own mass thicknesses. This indicates that the method is effective in mass thickness measurement of dual-sample of suitable thicknesses. (authors)

  8. Effect of thickness on structural, electrical, optical and magnetic properties of Co and Al doped ZnO films deposited by sol-gel route

    Energy Technology Data Exchange (ETDEWEB)

    Sharma, Mamta [Department of Electronic Science, University of Delhi South Campus, New Delhi 110021 (India); Mehra, R.M. [Department of Electronic Science, University of Delhi South Campus, New Delhi 110021 (India)], E-mail: rammehra2003@yahoo.com

    2008-12-30

    This paper reports deposition and characterization of Zn{sub 0.94}Co{sub 0.05}Al{sub 0.01}O films of thickness ranging from 70 nm to 400 nm. These films were deposited on a glass (Corning, 7059) substrate using sol-gel route. The films have been characterized to study their structural, electrical, optical and magnetic properties. X-ray diffraction (XRD) and atomic force microscopy (AFM) were used to study the crystallinity and growth mode of the films. The films deposited up to a thickness of 200 nm showed improvement in crystallinity and preferential c-axis orientation. A transition in the growth mode from vertical (c-axis) to lateral (a and b-axis) was observed with further increase in the thickness of the film. The average transmittance of the films for thickness less than 200 nm was above 80% in the visible region which decreased at higher thickness of the film. The resistivity of the film was found to decrease with increase in thickness up to 200 nm. Ferromagnetism, at room temperature, was confirmed for 200 nm and 400 nm thick films.

  9. Effect of thickness on structural, electrical, optical and magnetic properties of Co and Al doped ZnO films deposited by sol-gel route

    International Nuclear Information System (INIS)

    Sharma, Mamta; Mehra, R.M.

    2008-01-01

    This paper reports deposition and characterization of Zn 0.94 Co 0.05 Al 0.01 O films of thickness ranging from 70 nm to 400 nm. These films were deposited on a glass (Corning, 7059) substrate using sol-gel route. The films have been characterized to study their structural, electrical, optical and magnetic properties. X-ray diffraction (XRD) and atomic force microscopy (AFM) were used to study the crystallinity and growth mode of the films. The films deposited up to a thickness of 200 nm showed improvement in crystallinity and preferential c-axis orientation. A transition in the growth mode from vertical (c-axis) to lateral (a and b-axis) was observed with further increase in the thickness of the film. The average transmittance of the films for thickness less than 200 nm was above 80% in the visible region which decreased at higher thickness of the film. The resistivity of the film was found to decrease with increase in thickness up to 200 nm. Ferromagnetism, at room temperature, was confirmed for 200 nm and 400 nm thick films.

  10. Thickness-dependent electron mobility of single and few-layer MoS2 thin-film transistors

    Directory of Open Access Journals (Sweden)

    Ji Heon Kim

    2016-06-01

    Full Text Available We investigated the dependence of electron mobility on the thickness of MoS2 nanosheets by fabricating bottom-gate single and few-layer MoS2 thin-film transistors with SiO2 gate dielectrics and Au electrodes. All the fabricated MoS2 transistors showed on/off-current ratio of ∼107 and saturated output characteristics without high-k capping layers. As the MoS2 thickness increased from 1 to 6 layers, the field-effect mobility of the fabricated MoS2 transistors increased from ∼10 to ∼18 cm2V−1s−1. The increased subthreshold swing of the fabricated transistors with MoS2 thickness suggests that the increase of MoS2 mobility with thickness may be related to the dependence of the contact resistance and the dielectric constant of MoS2 layer on its thickness.

  11. Photocatalytic and photoelectrochemical properties of sol–gel TiO2 films of controlled thickness and porosity

    Czech Academy of Sciences Publication Activity Database

    Krýsa, J.; Baudyš, M.; Zlámal, M.; Krýsová, Hana; Morozová, Magdalena; Klusoň, Petr

    2014-01-01

    Roč. 230, JUL 2014 (2014), s. 2-7 ISSN 0920-5861 Institutional support: RVO:61388955 ; RVO:67985858 Keywords : TiO2 film * Sol-gel * Thickness Subject RIV: CF - Physical ; Theoretical Chemistry Impact factor: 3.893, year: 2014

  12. Thick Fe2O3, Fe3O4 films prepared by the chemical solution deposition method

    Czech Academy of Sciences Publication Activity Database

    Buršík, Josef; Košovan, P.; Šubrt, Jan

    2006-01-01

    Roč. 39, č. 2 (2006), s. 85-94 ISSN 0928-0707 R&D Projects: GA ČR GA203/01/0408 Institutional research plan: CEZ:AV0Z40320502 Keywords : chemical solution deposition * thick films * alpha-Fe2O3 Subject RIV: CA - Inorganic Chemistry Impact factor: 1.009, year: 2006

  13. Characterization of Films with Thickness Less than 10 nm by Sensitivity-Enhanced Atomic Force Acoustic Microscopy

    Directory of Open Access Journals (Sweden)

    Muraoka Mikio

    2011-01-01

    Full Text Available Abstract We present a method for characterizing ultrathin films using sensitivity-enhanced atomic force acoustic microscopy, where a concentrated-mass cantilever having a flat tip was used as a sensitive oscillator. Evaluation was aimed at 6-nm-thick and 10-nm-thick diamond-like carbon (DLC films deposited, using different methods, on a hard disk for the effective Young's modulus defined as E/(1 - ν2, where E is the Young's modulus, and ν is the Poisson's ratio. The resonant frequency of the cantilever was affected not only by the film's elasticity but also by the substrate even at an indentation depth of about 0.6 nm. The substrate effect was removed by employing a theoretical formula on the indentation of a layered half-space, together with a hard disk without DLC coating. The moduli of the 6-nm-thick and 10-nm-thick DLC films were 392 and 345 GPa, respectively. The error analysis showed the standard deviation less than 5% in the moduli.

  14. Effects of the thickness of gold deposited on a source backing film in the 4πβ-counting

    International Nuclear Information System (INIS)

    Miyahara, Hiroshi; Yoshida, Makoto; Watanabe, Tamaki

    1976-01-01

    A gold deposited VYNS film as a source backing in the 4πβ-counting has generally been used for reducing the absorption of β-rays. The thickness of the film with the gold is usually a few times thicker than the VYNS film itself. However, Because the appropriate thickness of gold has not yet been determined, the effects of gold thickness on electrical resistivity, plateau characteristics and β-ray counting efficiency were studied. 198 Au (960 keV), 60 Co(315 keV), 59 Fe(273 keV) and 95 Nb(160 keV), which were prepared as sources by the aluminium chloride treatment method, were used. Gold was evaporated under a deposition rate of 1 - 5 μg/cm 2 /min at a pressure less than 1 x 10 -5 Torr. Results show that the gold deposition on the side opposite the source after source preparation is essential. In this case, a maximum counting efficiency is obtained at the mean thickness of 2 μg/cm 2 . When gold is deposited only on the same side as the source, a maximum counting efficiency, which is less than that in the former case, is obtained at the mean thickness of 20 μg/cm 2 . (Evans, J.)

  15. Effects of Aloe Vera and Chitosan Nanoparticle Thin-Film Membranes on Wound Healing in Full Thickness Infected Wounds with Methicillin Resistant Staphylococcus Aureus.

    Science.gov (United States)

    Ranjbar, Reza; Yousefi, Alireza

    2018-01-01

    To assess effect of Aleo vera with chitosan nanoparticle biofilm on wound healing in full thickness infected wounds with antibiotic resistant gram positive bacteria. Thirty rats were randomized into five groups of six rats each. Group I: Animals with uninfected wounds treated with 0.9% saline solution. Group II: Animals with infected wounds treated with saline. Group III: Animals with infected wounds were dressed with chitosan nanoparticle thin-film membranes. Group IV: Animals with infected wounds were treated topically with Aloe vera and Group V: Animals with infected wounds were treated topically with Aloe vera and dressed with chitosan nanoparticle thin-film membranes. Wound size was measured on 6, 9, 12, 15, 18 and 21days after surgery. Microbiology, reduction in wound area and hydroxyproline contents indicated that there was significant difference ( p vera with chitosan nanoparticle thin-film membranes had a reproducible wound healing potential and hereby justified its use in practice.

  16. Magnetic properties of Pr-Fe-B thick-film magnets deposited on Si substrates with glass buffer layer

    Science.gov (United States)

    Nakano, M.; Kurosaki, A.; Kondo, H.; Shimizu, D.; Yamaguchi, Y.; Yamashita, A.; Yanai, T.; Fukunaga, H.

    2018-05-01

    In order to improve the magnetic properties of PLD-made Pr-Fe-B thick-film magnets deposited on Si substrates, an adoption of a glass buffer layer was carried out. The glass layer could be fabricated under the deposition rate of approximately 70 μm/h on a Si substrate using a Nd-YAG pulse laser in the vacuum atmosphere. The use of the layer enabled us to reduce the Pr content without a mechanical destruction and enhance (BH)max value by approximately 20 kJ/m3 compared with the average value of non-buffer layered Pr-Fe-B films with almost the same thickness. It is also considered that the layer is also effective to apply a micro magnetization to the films deposited on Si ones.

  17. Time-resolved analysis of thickness-dependent dewetting and ablation of silver films upon nanosecond laser irradiation

    Energy Technology Data Exchange (ETDEWEB)

    Qi, Dongfeng [Laser Thermal Laboratory, Department of Mechanical Engineering, University of California, Berkeley, California 94720-1740 (United States); Semiconductor Photonics Research Center, Department of Physics, Xiamen University, Xiamen 361005 (China); Paeng, Dongwoo; Yeo, Junyeob; Kim, Eunpa; Wang, Letian; Grigoropoulos, Costas P., E-mail: cgrigoro@berkeley.edu [Laser Thermal Laboratory, Department of Mechanical Engineering, University of California, Berkeley, California 94720-1740 (United States); Chen, Songyan [Semiconductor Photonics Research Center, Department of Physics, Xiamen University, Xiamen 361005 (China)

    2016-05-23

    Nanosecond pulsed laser dewetting and ablation of thin silver films is investigated by time-resolved imaging. Laser pulses of 532 nm wavelength and 5 ns temporal width are irradiated on silver films of different thicknesses (50 nm, 80 nm, and 350 nm). Below the ablation threshold, it is observed that the dewetting process does not conclude until 630 ns after the laser irradiation for all samples, forming droplet-like particles in the spot central region. At higher laser intensities, ablative material removal occurs in the spot center. Cylindrical rims are formed in the peripheral dewetting zone due to the solidification of transported matter at about 700 ns following the laser pulse exposure. In addition to these features, droplet fingers are superposed upon irradiation of 350-nm thick silver films with higher intensity.

  18. Directional solidification of YBaCuO thick films deposited by screen printing on Ag and Ag-Pd tapes

    Science.gov (United States)

    Piñol, S.; Najib, M.; Puig, T.; Obradors, X.; Xuriguera, H.; Segarra, M.

    2002-08-01

    Textured tapes of Ag{1 1 0} and polycrystalline tapes of Ag-Pd(0.5-12.5%) alloys have been prepared by cold rolling as possible substrates for deposition of high critical current density YBCO films. The Ag{1 1 0} texture with some twins was promoted by recrystallization after cold rolling from ingots prepared by melting and solidification of Ag powders. Nevertheless, no textured tapes were obtained by cold rolling from Ag-Pd alloys with Pd>0.5%. YBCO thick films (10-30 μm) were deposited on the metallic tapes by screen printing using organic inks. Biaxially textured superconducting thick films were observed on the Ag{1 1 0} substrates at low solidification rates. Nevertheless, uniaxial texture with some biaxial colonies of YBCO grains were found on Ag-Pd alloys when the superconducting phase was solidified at high rate.

  19. Process-structure-property relationships of micron thick gadolinium oxide films deposited by reactive electron beam-physical vapor deposition (EB-PVD)

    Science.gov (United States)

    Grave, Daniel A.

    Gadolinium oxide (Gd2O3) is an attractive material for solid state neutron detection due to gadolinium's high thermal neutron capture cross section. Development of neutron detectors based on Gd2 O3 requires sufficiently thick films to ensure neutron absorption. In this dissertation work, the process-structure-property relationships of micron thick Gd2O3 films deposited by reactive electron-beam physical vapor deposition (EB-PVD) were studied. Through a systematic design of experiments, fundamental studies were conducted to determine the effects of processing conditions such as deposition temperature, oxygen flow rate, deposition rate, and substrate material on Gd2O3 film crystallographic phase, texture, morphology, grain size, density, and surface roughness. Films deposited at high rates (> 5 A/s) were examined via x-ray diffraction (XRD) and Raman spectroscopy. Quantitative phase volume calculations were performed via a Rietveld refinement technique. All films deposited at high rates were found to be fully monoclinic or mixed cubic/monoclinic phase. Generally, increased deposition temperature and increased oxygen flow resulted in increased cubic phase volume. As film thickness increased, monoclinic phase volume increased. Grazing incidence x-ray diffraction (GIXRD) depth profiling analysis showed that cubic phase was only present under large incidence angle (large penetration depth) measurements, and after a certain point, only monoclinic phase was grown. This was confirmed by transmission electron microscopy (TEM) analysis with selected area diffraction (SAD). Based on this information, a large compressive stress was hypothesized to cause the formation of the monoclinic phase and this hypothesis was confirmed by demonstrating the existence of a stress induced phase transition. An experiment was designed to introduce compressive stress into the Gd2O 3 films via ion beam assisted deposition (IBAD). This allowed for systematic increase in compressive stress while

  20. Homogeneity analysis of high yield manufacturing process of mems-based pzt thick film vibrational energy harvesters

    DEFF Research Database (Denmark)

    Lei, Anders; Xu, Ruichao; Pedersen, C.M.

    2011-01-01

    This work presents a high yield wafer scale fabrication of MEMS-based unimorph silicon/PZT thick film vibrational energy harvesters aimed towards vibration sources with peak frequencies in the range of a few hundred Hz. By combining KOH etching with mechanical front side protection, SOI wafer...... to accurately define the thickness of the silicon part of the harvester and a silicon compatible PZT thick film screen-printing technique, we are able to fabricate energy harvesters on wafer scale with a yield higher than 90%. The characterization of the fabricated harvesters is focused towards the full wafer....../mass-production aspect; hence the analysis of uniformity in harvested power and resonant frequency....

  1. Investigation of the fabrication parameters of thick film metal oxide-polymer pH electrodes

    International Nuclear Information System (INIS)

    Gac, Arnaud

    2002-01-01

    This thesis describes a study into the development of an optimum material and fabrication process for the production of thick film pH electrodes. These devices consist of low cost, miniature and rugged pH sensors formed by screen printing a metal oxide bearing paste onto a high temperature (∼850 deg C) fired metal back contact supported on a standard alumina substrate. The pH sensitive metal oxide layer must be fabricated at relatively low temperatures (<300 deg C) in order to maintain the pH sensitivity of the layer and hence requires the use of a suitably stable low temperature curing binder. Bespoke fabricated inks are derived from a Taguchi style factorial experimental plans in which, different binder types, curing temperatures, hydration level and percentage mixtures of different metal oxides and layer thicknesses were investigated. The pH responses of 18 printed electrodes per batch were assessed in buffer solutions with respect to a commercial reference electrode forming a complete potentiometric circuit. The evaluation criteria used in the study included the device-to-device variation in sensitivity of the pH sensors and their sensitivity variation as a function of time. The results indicated the importance of the choice of binder type in particular on the performance characteristics. Reproducible device-to-device variation in sensitivity was determined for the best inks found, whatever the ink fabrication batch. A reduction in the sensitivity variation with time has been determined using the mathematical models derived from an experimental plan. The lack of reproducibility of the sensitivity magnitude, regardless of the ink manufacturing batch, seems to be a recurrent problem with prototype inks. Experimental sub-Nernstian responses are discussed in the light of possible pH mechanisms. (author)

  2. Synthesis and Characterization of Pure and Al Modified BaSnO3 Thick Film Resistor and Studies of its Gas Sensing Performance

    Directory of Open Access Journals (Sweden)

    N. U. PATIL

    2013-02-01

    Full Text Available In this work we report the synthesis, microstructure, electric properties and sensing performance of BaSnO3 (BS powder, it was prepared by solid state mechano-chemical method. As prepared powder is calcinated at temperatures 1000 °C and 1200 °C and tested for crystallization. Thick films were prepared using simple yet effective screen-printing technology. Structural and electrical analyses were performed and the results have been correlated. The pure BS film shows good response (S=9.8 to NH3 at elevated temperature up to 500 °C along with response other gases with lower sensitivity such as CO2, CO, H2S for various gas concentrations, when the pure film is surface modified with Al2O3, film improves the selectivity and sensitivity. Maximum response (S=21.2 was found to H2S gas at temperature of 300 °C for gas concentration as low as up to 100 ppm. The characterization of the films was done by XRD, SEM and TGA. Crystallite size, surface area, electric properties and gas sensitivity of the films were measured and presented.

  3. Experimental studies of O{sub 2}-SnO{sub 2} surface interaction using powder, thick films and monocrystalline thin films

    Energy Technology Data Exchange (ETDEWEB)

    Saukko, S. [Microelectronics and Materials Physics Laboratories, University of Oulu, FIN-90014 Oulu (Finland)]. E-mail: ssaukko@ee.oulu.fi; Lassi, Ulla [Department of Process and Environmental Engineering, University of Oulu, FIN-90014 Oulu (Finland); Lantto, V. [Microelectronics and Materials Physics Laboratories, University of Oulu, FIN-90014 Oulu (Finland); Kroneld, M. [Electron Physics Laboratory, Helsinki University of Technology (Finland); Novikov, S. [Electron Physics Laboratory, Helsinki University of Technology (Finland); Kuivalainen, P. [Electron Physics Laboratory, Helsinki University of Technology (Finland); Rantala, T.T. [Institute of Physics, Tampere University of Technology, FIN-33101 Tampere (Finland); Mizsei, J. [Department of Electron Devices, Budapest University of Technology and Economics, Goldmann Gy. ter 3, Budapest 1521 (Hungary)

    2005-10-21

    Surface properties of solids and the interactions between molecules and solid surfaces are important for many technical applications. They also involve a range of physical and chemical phenomena of fundamental scientific interest. The importance of oxygen chemistry at SnO{sub 2} surfaces follows from the fact that SnO{sub 2} is used as an active material in gas sensor applications. The operation principle of these sensors is usually based on measurable conductance response of the material, which is understood in terms of reactions of gas molecules with different oxygen species adsorbed onto the surface. The role of the lattice oxygen, but in particular, the bridging oxygen atoms on SnO{sub 2} surfaces, is also active. Detailed understanding of the reaction mechanisms of various oxygen species at SnO{sub 2} surfaces is important, as it offers a way to improve the sensitivity and selectivity of the sensors. Oxygen adsorption-desorption kinetics at the SnO{sub 2} surface is studied experimentally using O{sub 2}-temperature-programmed desorption (TPD) method together with conductance measurements in the case of SnO{sub 2} powder and polycrystalline thick films made from the powder. In addition, CO-TPD is studied and the transient behaviour of various oxygen species is considered. Molecular beam epitaxy (MBE) was also used to fabricate polycrystalline and monocrystalline thin films with the SnO{sub 2}(101) face on single crystal sapphire substrate. Simultaneous surface potential and conductance measurements during heating and cooling in different ambient atmospheres were used to characterize the monocrystalline SnO{sub 2}(101) surface after various surface treatments.

  4. Measurement of the bremsstrahlung spectra generated from thick ...

    Indian Academy of Sciences (India)

    with those predicted by Monte-Carlo (MC) calculations using PENELOPE code. A close agreement between the ... cross-sections; Monte-Carlo simulation. PACS Nos 34.80.-i; 78.70.-g; 33.20. ... Quarles [13] proposed a model for calculating the thick target bremsstrahlung cross- sections for incident electrons having ...

  5. Dependence on film thickness of grain boundary low-field magnetoresistance in thin films of La0.7Ca0.3MnO3

    International Nuclear Information System (INIS)

    Todd, N. K.; Mathur, N. D.; Blamire, M. G.

    2001-01-01

    The magnetoresistance of grain boundaries in the perovskite manganites is being studied, both in polycrystalline materials, and thin films grown on bicrystal substrates, because of interest in low-field applications. In this article we show that epitaxial films grown on SrTiO 3 bicrystal substrates of 45 degree misorientation show magnetoresistance behavior which is strongly dependent on the thickness of the film. Thin films, e.g., 40 nm, can show a large low-field magnetoresistance at low temperatures, with very sharp switching between distinct high and low resistance states for fields applied in plane and parallel to the boundary. Thicker films show a more complex behavior of resistance as a function of field, and the dependence on the angle between the applied field and the grain boundary is altered. These changes in magnetoresistance behavior are linked to the variation in morphology of the films. Thin films are coherently strained, due to the mismatch with the substrate, and very smooth. Thicker films relax, with the formation of defects, and hence different micromagnetic behavior. [copyright] 2001 American Institute of Physics

  6. Structural health monitoring ultrasonic thickness measurement accuracy and reliability of various time-of-flight calculation methods

    Science.gov (United States)

    Eason, Thomas J.; Bond, Leonard J.; Lozev, Mark G.

    2016-02-01

    The accuracy, precision, and reliability of ultrasonic thickness structural health monitoring systems are discussed in-cluding the influence of systematic and environmental factors. To quantify some of these factors, a compression wave ultrasonic thickness structural health monitoring experiment is conducted on a flat calibration block at ambient temperature with forty four thin-film sol-gel transducers and various time-of-flight thickness calculation methods. As an initial calibration, the voltage response signals from each sensor are used to determine the common material velocity as well as the signal offset unique to each calculation method. Next, the measurement precision of the thickness error of each method is determined with a proposed weighted censored relative maximum likelihood analysis technique incorporating the propagation of asymmetric measurement uncertainty. The results are presented as upper and lower confidence limits analogous to the a90/95 terminology used in industry recognized Probability-of-Detection assessments. Future work is proposed to apply the statistical analysis technique to quantify measurement precision of various thickness calculation methods under different environmental conditions such as high temperature, rough back-wall surface, and system degradation with an intended application to monitor naphthenic acid corrosion in oil refineries.

  7. Practicable methods for histological section thickness measurement in quantitative stereological analyses

    Science.gov (United States)

    Matenaers, Cyrill; Popper, Bastian; Rieger, Alexandra; Wanke, Rüdiger

    2018-01-01

    The accuracy of quantitative stereological analysis tools such as the (physical) disector method substantially depends on the precise determination of the thickness of the analyzed histological sections. One conventional method for measurement of histological section thickness is to re-embed the section of interest vertically to its original section plane. The section thickness is then measured in a subsequently prepared histological section of this orthogonally re-embedded sample. However, the orthogonal re-embedding (ORE) technique is quite work- and time-intensive and may produce inaccurate section thickness measurement values due to unintentional slightly oblique (non-orthogonal) positioning of the re-embedded sample-section. Here, an improved ORE method is presented, allowing for determination of the factual section plane angle of the re-embedded section, and correction of measured section thickness values for oblique (non-orthogonal) sectioning. For this, the analyzed section is mounted flat on a foil of known thickness (calibration foil) and both the section and the calibration foil are then vertically (re-)embedded. The section angle of the re-embedded section is then calculated from the deviation of the measured section thickness of the calibration foil and its factual thickness, using basic geometry. To find a practicable, fast, and accurate alternative to ORE, the suitability of spectral reflectance (SR) measurement for determination of plastic section thicknesses was evaluated. Using a commercially available optical reflectometer (F20, Filmetrics®, USA), the thicknesses of 0.5 μm thick semi-thin Epon (glycid ether)-sections and of 1–3 μm thick plastic sections (glycolmethacrylate/ methylmethacrylate, GMA/MMA), as regularly used in physical disector analyses, could precisely be measured within few seconds. Compared to the measured section thicknesses determined by ORE, SR measures displayed less than 1% deviation. Our results prove the applicability

  8. Experimental study on two-dimensional film flow with local measurement methods

    International Nuclear Information System (INIS)

    Yang, Jin-Hwa; Cho, Hyoung-Kyu; Kim, Seok; Euh, Dong-Jin; Park, Goon-Cherl

    2015-01-01

    Highlights: • An experimental study on the two-dimensional film flow with lateral air injection was performed. • The ultrasonic thickness gauge was used to measure the local liquid film thickness. • The depth-averaged PIV (Particle Image Velocimetry) method was applied to measure the local liquid film velocity. • The uncertainty of the depth-averaged PIV was quantified with a validation experiment. • Characteristics of two-dimensional film flow were classified following the four different flow patterns. - Abstract: In an accident condition of a nuclear reactor, multidimensional two-phase flows may occur in the reactor vessel downcomer and reactor core. Therefore, those have been regarded as important issues for an advanced thermal-hydraulic safety analysis. In particular, the multi-dimensional two-phase flow in the upper downcomer during the reflood phase of large break loss of coolant accident appears with an interaction between a downward liquid and a transverse gas flow, which determines the bypass flow rate of the emergency core coolant and subsequently, the reflood coolant flow rate. At present, some thermal-hydraulic analysis codes incorporate multidimensional modules for the nuclear reactor safety analysis. However, their prediction capability for the two-phase cross flow in the upper downcomer has not been validated sufficiently against experimental data based on local measurements. For this reason, an experimental study was carried out for the two-phase cross flow to clarify the hydraulic phenomenon and provide local measurement data for the validation of the computational tools. The experiment was performed in a 1/10 scale unfolded downcomer of Advanced Power Reactor 1400 (APR1400). Pitot tubes, a depth-averaged PIV method and ultrasonic thickness gauge were applied for local measurement of the air velocity, the liquid film velocity and the liquid film thickness, respectively. The uncertainty of the depth-averaged PIV method for the averaged

  9. Impact of device size and thickness of Al2O3 film on the Cu pillar and resistive switching characteristics for 3D cross-point memory application

    Science.gov (United States)

    Panja, Rajeswar; Roy, Sourav; Jana, Debanjan; Maikap, Siddheswar

    2014-12-01

    Impact of the device size and thickness of Al2O3 film on the Cu pillars and resistive switching memory characteristics of the Al/Cu/Al2O3/TiN structures have been investigated for the first time. The memory device size and thickness of Al2O3 of 18 nm are observed by transmission electron microscope image. The 20-nm-thick Al2O3 films have been used for the Cu pillar formation (i.e., stronger Cu filaments) in the Al/Cu/Al2O3/TiN structures, which can be used for three-dimensional (3D) cross-point architecture as reported previously Nanoscale Res. Lett.9:366, 2014. Fifty randomly picked devices with sizes ranging from 8 × 8 to 0.4 × 0.4 μm2 have been measured. The 8-μm devices show 100% yield of Cu pillars, whereas only 74% successful is observed for the 0.4-μm devices, because smaller size devices have higher Joule heating effect and larger size devices show long read endurance of 105 cycles at a high read voltage of -1.5 V. On the other hand, the resistive switching memory characteristics of the 0.4-μm devices with a 2-nm-thick Al2O3 film show superior as compared to those of both the larger device sizes and thicker (10 nm) Al2O3 film, owing to higher Cu diffusion rate for the larger size and thicker Al2O3 film. In consequence, higher device-to-device uniformity of 88% and lower average RESET current of approximately 328 μA are observed for the 0.4-μm devices with a 2-nm-thick Al2O3 film. Data retention capability of our memory device of >48 h makes it a promising one for future nanoscale nonvolatile application. This conductive bridging resistive random access memory (CBRAM) device is forming free at a current compliance (CC) of 30 μA (even at a lowest CC of 0.1 μA) and operation voltage of ±3 V at a high resistance ratio of >104.

  10. High-current-density electrodeposition using pulsed and constant currents to produce thick CoPt magnetic films on silicon substrates

    Science.gov (United States)

    Ewing, Jacob; Wang, Yuzheng; Arnold, David P.

    2018-05-01

    This paper investigates methods for electroplating thick (>20 μm), high-coercivity CoPt films using high current densities (up to 1 A/cm2) and elevated bath temperatures (70 °C). Correlations are made tying current-density and temperature process parameters with plating rate, elemental ratio and magnetic properties of the deposited CoPt films. It also investigates how pulsed currents can increase the plating rate and film to substrate adhesion. Using 500 mA/cm2 and constant current, high-quality, dense CoPt films were successfully electroplated up to 20 μm thick in 1 hr on silicon substrates (0.35 μm/min plating rate). After standard thermal treatment (675°C, 30 min) to achieve the ordered L10 crystalline phase, strong magnetic properties were measured: coercivities up 850 kA/m, remanences >0.5 T, and maximum energy products up to 46 kJ/m3.

  11. High performance hard magnetic NdFeB thick films for integration into micro-electro-mechanical systems

    International Nuclear Information System (INIS)

    Dempsey, N. M.; Walther, A.; May, F.; Givord, D.; Khlopkov, K.; Gutfleisch, O.

    2007-01-01

    5 μm thick NdFeB films have been sputtered onto 100 mm Si substrates using high rate sputtering (18 μm/h). Films were deposited at ≤500 deg. C and then annealed at 750 deg. C for 10 min. While films deposited at temperatures up to 450 deg. C have equiaxed grains, the size of which decreases with increasing deposition temperature, the films deposited at 500 deg. C have columnar grains. The out-of-plane remanent magnetization increases with deposition temperature, reaching a maximum value of 1.4 T, while the coercivity remains constant at about 1.6 T. The maximum energy product achieved (400 kJ/m 3 ) is comparable to that of high-quality NdFeB sintered magnets

  12. Exploring electronic structure of one-atom thick polycrystalline graphene films: A nano angle resolved photoemission study

    Science.gov (United States)

    Avila, José; Razado, Ivy; Lorcy, Stéphane; Fleurier, Romain; Pichonat, Emmanuelle; Vignaud, Dominique; Wallart, Xavier; Asensio, María C.

    2013-01-01

    The ability to produce large, continuous and defect free films of graphene is presently a major challenge for multiple applications. Even though the scalability of graphene films is closely associated to a manifest polycrystalline character, only a few numbers of experiments have explored so far the electronic structure down to single graphene grains. Here we report a high resolution angle and lateral resolved photoelectron spectroscopy (nano-ARPES) study of one-atom thick graphene films on thin copper foils synthesized by chemical vapor deposition. Our results show the robustness of the Dirac relativistic-like electronic spectrum as a function of the size, shape and orientation of the single-crystal pristine grains in the graphene films investigated. Moreover, by mapping grain by grain the electronic dynamics of this unique Dirac system, we show that the single-grain gap-size is 80% smaller than the multi-grain gap recently reported by classical ARPES. PMID:23942471

  13. Influence of the film thickness on the structure, optical and electrical properties of ITO coatings deposited by sputtering at room temperature on glass and plastic substrates

    International Nuclear Information System (INIS)

    Guillén, C; Herrero, J

    2008-01-01

    Transparent and conductive indium tin oxide (ITO) films with thickness between 0.2 and 0.7 µm were deposited by sputtering at room temperature on glass and polyethylene terephthalate (PET) substrates. All films were polycrystalline, with crystallite size increasing and lattice distortion decreasing when the film thickness was increased. Besides, transmission in the near-infrared region is found to be decreasing and carrier concentration increasing when the film thickness was increased. For the same thickness, the lattice distortion is slightly lower and the carrier concentration higher for the layers grown on PET substrates. A direct relationship between the lattice distortion and the free carrier concentration has been established, applying to the films grown on glass and plastic substrates. By adjusting ITO coating thickness, sheet resistance below 15 Ω sq −1 and average visible transmittance about 90% have been achieved by sputtering at room temperature

  14. Central Corneal Thickness Measurement by Ultrasound versus Orbscan II

    Directory of Open Access Journals (Sweden)

    Amir Faramarzi

    2008-12-01

    Full Text Available

    PURPOSE: To compare Orbscan II and ultrasonic pachymetry for measurement of central corneal thickness (CCT in eyes scheduled for keratorefractive surgery. METHODS: CCT was measured using Orbscan II (Bausch & Lomb, USA and then by ultrasonic pachymetry (Tomey SP-3000, Tomey Ltd, Japan in 100 eyes of 100 patients with no history of ocular surgery scheduled for excimer laser refractive surgery. RESULTS: Mean CCT was 544.7±35.5 (range 453-637 µm by ultrasonic pachymetry versus 546.9±41.6 (range 435-648 µm measured by Orbscan II applying an acoustic factor of 0.92 (P=0.14. The standard deviation of measurements was greater with Orbscan pachymetry but the difference was not statistically significant. CONCLUSION: CCT measurements by Orbscan II (applying an acoustic factor and by ultrasonic pachymetry are not significantly different; however, when CCT readings by Orbscan II are in the lower range, it is advisable to recheck the measurements using ultrasonic pachymetry.