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Sample records for field-ion microscope atom

  1. Atom probe field ion microscope study of the range and diffusivity of helium in tungsten

    Energy Technology Data Exchange (ETDEWEB)

    Wagner, A.

    1978-08-01

    A time-of-flight (TOF) atom-probe field-ion microscope (FIM) specifically designed for the study of defects in metals is described. With this automated system 600 TOF min/sup -1/ can be recorded and analyzed. Performance tests of the instrument demonstrated that (1) the seven isotopes of molybdenum and the five isotopes of tungsten can be clearly resolved; and (2) the concentration and spatial distribution of all constitutents present at levels greater than 0.05 at. % in a W--25 at. % Re, Mo--1.0 at. % Ti, Mo--1.0 at. % Ti--0.08 at. % Zr (TZM), a low swelling stainless steel (LS1A) and a metallic glass (Metglas 2826) can be measured. The effect of the rate of field evaporation on the quantitative atom probe analysis of a Mo--1.0 at. % Ti alloy and a Mo--1.0 at. % Ti--0.08 at. % Zr alloy was investigated. As the field evaporation rate increased the measured Ti concentration was found to also increase. A simple qualitative model was proposed to explain the observation. The spatial distribution of titanium in a fast neutron irradiated Mo--1.0 at. % Ti alloy has been investigated. No evidence of Ti segregation to the voids was detected nor has any evidence of significant resolution of Ti from the TiC precipitates been detected. A small amount of segregation of carbon to a void was detected.

  2. High-performance atom-probe field ion microscope study of segregation and hydrogen cracking in Fe-0. 29 Ti

    Energy Technology Data Exchange (ETDEWEB)

    Kuk, Y.; Pickering, H.W.; Sakurai, T.

    1980-01-01

    With the greatly improved resolution now available in energy focused atom probes, hydrogen can be readily resolved even when combined with metals having several isotopes. In addition to finding that H, H/sub 2/, FeH and TiH/sub 2/ accumulate at segregated grain boundaries in Fe-0.29 wt % Ti, a striking observation was made - the formation and propagation of a microcrack when the (field ion microscope) tip was exposed to hydrogen gas at elevated temperature. A small crack (approx. 200 A in length) was first noticed at a grain-boundary intersection during field ion imaging. This was an open crack, formed by detachment of metal between the intersecting grain boundaries, which was observed to be much larger after the tip was reheated to 1300/sup 0/K for 10 min. in the presence of 10/sup 2/ Pa (1 torr) H/sub 2/. This crack could be easily reduced in size by gradually field evaporating the surface. Its propagation was repeated several times and reproducible results were obtained. Hydrogen was identified in quantity in the crack surface, though not elsewhere. The observation of H/sub 2/ is taken to mean that H/sub 2/ gas was trapped in the grain boundary. The grain boundary was also observed to be enriched in Ti, O, C and S, in agreement with earlier results for Fe-Ti.

  3. Microscopic techniques bridging between nanoscale and microscale with an atomically sharpened tip - field ion microscopy/scanning probe microscopy/ scanning electron microscopy.

    Science.gov (United States)

    Tomitori, Masahiko; Sasahara, Akira

    2014-11-01

    Over a hundred years an atomistic point of view has been indispensable to explore fascinating properties of various materials and to develop novel functional materials. High-resolution microscopies, rapidly developed during the period, have taken central roles in promoting materials science and related techniques to observe and analyze the materials. As microscopies with the capability of atom-imaging, field ion microscopy (FIM), scanning tunneling microscopy (STM), atomic force microscopy (AFM) and transmission electron microscopy (TEM) can be cited, which have been highly evaluated as methods to ultimately bring forward the viewpoint of reductionism in materials science. On one hand, there have been difficulties to derive useful and practical information on large (micro) scale unique properties of materials using these excellent microscopies and to directly advance the engineering for practical materials. To make bridges over the gap between an atomic scale and an industrial engineering scale, we have to develop emergence science step-by-step as a discipline having hierarchical structures for future prospects by combining nanoscale and microscale techniques; as promising ways, the combined microscopic instruments covering the scale gap and the extremely sophisticated methods for sample preparation seem to be required. In addition, it is noted that spectroscopic and theoretical methods should implement the emergence science.Fundamentally, the function of microscope is to determine the spatial positions of a finite piece of material, that is, ultimately individual atoms, at an extremely high resolution with a high stability. To define and control the atomic positions, the STM and AFM as scanning probe microscopy (SPM) have successfully demonstrated their power; the technological heart of SPM lies in an atomically sharpened tip, which can be observed by FIM and TEM. For emergence science we would like to set sail using the tip as a base. Meanwhile, it is significant

  4. Atom probe field ion microscopy of high resistivity materials

    Energy Technology Data Exchange (ETDEWEB)

    Sibrandij, S.J.; Larson, D.J.; Miller, M.K.

    1998-02-01

    Over the last 30 years the atom probe has proved to be a powerful tool for studying nanometer-sized compositional fluctuations in a wide range of metallic alloys but has had only limited applications to semiconductors and ceramics. One of the primary reasons for this difference is the higher resistivity of semiconducting and ceramic specimens. Because of this high resistivity, the high voltage field evaporation pulse is attenuated before it reaches the apex of the specimen thereby making the pulse ineffective for field evaporation. Experiments have demonstrated that both variants of the voltage-pulsed atom probe (i.e., those instruments in which the field evaporation pulse is applied directly to the specimen and those in which the negative pulse is applied to a counter electrode in front of the specimen) are equally affected. In this overview, the limits of applicability of the voltage-pulsed atom probe to high resistivity materials are examined. In this study, a wide range of materials have been examined to determine whether field ion microscopy and voltage-pulsed field evaporation can be achieved and the results are summarized in the report. Field ion microscopy including dc field evaporation was possible for all materials except bulk ceramic insulators and glasses. Field ion microscopy requires some conductivity both to achieve a high electric field at the apex of the specimen, and also to support the field ion current. In contrast, voltage-pulsed field evaporation requires transmission of the pulse to the apex of the specimen. All metallic alloys including high resistance alloys and metallic glasses were successfully field evaporated with a voltage pulse. Specimens that were produced from bulk material of several conducting ceramics including MoSi, TiB and TiC were also successfully field evaporated with a voltage pulse.

  5. Atom probe field ion microscopy and related topics: A bibliography 1992

    Energy Technology Data Exchange (ETDEWEB)

    Russell, K.F.; Godfrey, R.D.; Miller, M.K.

    1993-12-01

    This bibliography contains citations of books, conference proceedings, journals, and patents published in 1992 on the following types of microscopy: atom probe field ion microscopy (108 items); field emission microscopy (101 items); and field ion microscopy (48 items). An addendum of 34 items missed in previous bibliographies is included.

  6. Atomic Force Microscope

    Energy Technology Data Exchange (ETDEWEB)

    Day, R.D.; Russell, P.E.

    1988-12-01

    The Atomic Force Microscope (AFM) is a recently developed instrument that has achieved atomic resolution imaging of both conducting and non- conducting surfaces. Because the AFM is in the early stages of development, and because of the difficulty of building the instrument, it is currently in use in fewer than ten laboratories worldwide. It promises to be a valuable tool for obtaining information about engineering surfaces and aiding the .study of precision fabrication processes. This paper gives an overview of AFM technology and presents plans to build an instrument designed to look at engineering surfaces.

  7. Atom probe field-ion microscopy and related topics: A bibliography, 1988

    Energy Technology Data Exchange (ETDEWEB)

    Miller, M.K.; Hawkins, A.R.

    1989-10-01

    This bibliography includes references related to the following topics: field-ion microscopy (FIM), field emission microscopy (FEM), atom probe field-ion microscopy (APFIM), and liquid metal ion sources (LMIS). Technique-orientated studies and applications are included. The references contained in this document were compiled from a variety of sources including computer searches and personal lists of publications. To reduce the length of this document, the references have been reduced to the minimum necessary to locate the articles.

  8. Atom probe field ion microscopy and related topics: A bibliography 1989

    Energy Technology Data Exchange (ETDEWEB)

    Miller, M.K.; Hawkins, A.R.; Russell, K.F.

    1990-12-01

    This bibliography includes references related to the following topics: atom probe field ion microscopy (APFIM), field ion spectroscopy (FIM), field emission microscopy (FEM), liquid metal ion sources (LMIS), scanning tunneling microscopy (STM), and theory. Technique-orientated studies and applications are included. This bibliography covers the period 1989. The references contained in this document were compiled from a variety of sources including computer searches and personal lists of publications.

  9. Atomic Force Microscope Operation

    Science.gov (United States)

    2008-01-01

    [figure removed for brevity, see original site] Click on image for animation (large file) This animation is a scientific illustration of the operation of NASA's Phoenix Mars Lander's Atomic Force Microscope, or AFM. The AFM is part of Phoenix's Microscopy, Electrochemistry, and Conductivity Analyzer, or MECA. The AFM is used to image the smallest Martian particles using a very sharp tip at the end of one of eight beams. The beam of the AFM is set into vibration and brought up to the surface of a micromachined silicon substrate. The substrate has etched in it a series of pits, 5 micrometers deep, designed to hold the Martian dust particles. The microscope then maps the shape of particles in three dimensions by scanning them with the tip. At the end of the animation is a 3D representation of the AFM image of a particle that was part of a sample informally called 'Sorceress.' The sample was delivered to the AFM on the 38th Martian day, or sol, of the mission (July 2, 2008). The image shows four round pits, only 5 microns in depth, that were micromachined into the silicon substrate. A Martian particle only one micrometer, or one millionth of a meter, across is held in the upper left pit. The rounded particle shown at the highest magnification ever seen from another world is a particle of the dust that cloaks Mars. Such dust particles color the Martian sky pink, feed storms that regularly envelop the planet and produce Mars' distinctive red soil. The AFM was developed by a Swiss-led consortium, with Imperial College London producing the silicon substrate that holds sampled particles. The Phoenix Mission is led by the University of Arizona, Tucson, on behalf of NASA. Project management of the mission is by NASA's Jet Propulsion Laboratory, Pasadena, Calif. Spacecraft development is by Lockheed Martin Space Systems, Denver.

  10. Atom probe field ion microscopy and related topics: A bibliography 1990

    Energy Technology Data Exchange (ETDEWEB)

    Russell, K.F.; Miller, M.K.

    1991-12-01

    This bibliography includes references related to the following topics: atom probe field ion microscopy (APFIM), field ion microscopy (FIM), field emission (FE), ion sources, and field desorption mass microscopy (FDMM). Technique-orientated studies and applications are included. The bibliography covers the period 1990. The references contained in this document were compiled from a variety of sources including computer searches and personal lists of publications. To reduce the length of this document, the references have been reduced to the minimum necessary to locate the articles. The references, listed alphabetically by authors, are subdivided into the categories listed in paragraph one above. An Addendum of references missed in previous bibliographies is included.

  11. Atom probe field ion microscopy and related topics: A bibliography 1993

    Energy Technology Data Exchange (ETDEWEB)

    Godfrey, R.D.; Miller, M.K.; Russell, K.F.

    1994-10-01

    This bibliography, covering the period 1993, includes references related to the following topics: atom probe field ion microscopy (APFIM), field emission (FE), and field ion microscopy (FIM). Technique-oriented studies and applications are included. The references contained in this document were compiled from a variety of sources including computer searches and personal lists of publications. To reduce the length of this document, the references have been reduced to the minimum necessary to locate the articles. The references are listed alphabetically by authors, an Addendum of references missed in previous bibliographies is included.

  12. Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope.

    Science.gov (United States)

    Hagedorn, Till; El Ouali, Mehdi; Paul, William; Oliver, David; Miyahara, Yoichi; Grütter, Peter

    2011-11-01

    A modification of the common electrochemical etching setup is presented. The described method reproducibly yields sharp tungsten tips for usage in the scanning tunneling microscope and tuning fork atomic force microscope. In situ treatment under ultrahigh vacuum (p ≤10(-10) mbar) conditions for cleaning and fine sharpening with minimal blunting is described. The structure of the microscopic apex of these tips is atomically resolved with field ion microscopy and cross checked with field emission.

  13. Specimen preparation and atom probe field ion microscopy of BSCCO-2212 superconductors

    Energy Technology Data Exchange (ETDEWEB)

    Larson, D.J. [Wisconsin Univ., Madison, WI (United States). Mater. Sci. Program]|[Applied Superconductivity Center, Univ. of Wisconsin, Madison, WI (United States); Camus, P.P. [Applied Superconductivity Center, Univ. of Wisconsin, Madison, WI (United States)]|[Wisconsin Univ., Madison, WI (United States). Dept. of Materials Sciences and Engineering; Vargas, J.L. [Applied Superconductivity Center, Univ. of Wisconsin, Madison, WI (United States); Kelly, T.F. [Wisconsin Univ., Madison, WI (United States). Mater. Sci. Program]|[Applied Superconductivity Center, Univ. of Wisconsin, Madison, WI (United States)]|[Wisconsin Univ., Madison, WI (United States). Dept. of Materials Sciences and Engineering; Miller, M.K. [Oak Ridge National Lab., TN (United States). Metals and Ceramics Div.

    1996-09-01

    Field ion specimens of Bi{sub 2}Sr{sub 2}CaCu{sub 2}O{sub x} (BSCCO) high temperature superconductor (HTS) materials have been prepared using a combination of three different preparation techniques: the method of sharp shards, electropolishing and ion milling. Field ion microscopy (FIM) has demonstrated that samples which exhibit the ``striped``-image contrast characteristic of HTS materials can be successfully fabricated using this combination. FIM images have been obtained which show the striped-image contrast much clearer than any previously published images of Pb-free BSCCO. Preliminary atom probe (AP) chemical analysis of the material was also performed. Analytical electron microscopy was used to confirm the existence of both the correct crystallographic structure and nominal composition in the near-apex region of the specimen after preparation and FIM. (orig.).

  14. Coaxial Atomic Force Microscope Tweezers

    CERN Document Server

    Brown, K A; Westervelt, R M

    2010-01-01

    We demonstrate coaxial atomic force microscope (AFM) tweezers that can trap and place small objects using dielectrophoresis (DEP). An attractive force is generated at the tip of a coaxial AFM probe by applying a radio frequency voltage between the center conductor and a grounded shield; the origin of the force is found to be DEP by measuring the pull-off force vs. applied voltage. We show that the coaxial AFM tweezers (CAT) can perform three dimensional assembly by picking up a specified silica microsphere, imaging with the microsphere at the end of the tip, and placing it at a target destination.

  15. Atomic Force Microscope Mediated Chromatography

    Science.gov (United States)

    Anderson, Mark S.

    2013-01-01

    The atomic force microscope (AFM) is used to inject a sample, provide shear-driven liquid flow over a functionalized substrate, and detect separated components. This is demonstrated using lipophilic dyes and normal phase chromatography. A significant reduction in both size and separation time scales is achieved with a 25-micron-length column scale, and one-second separation times. The approach has general applications to trace chemical and microfluidic analysis. The AFM is now a common tool for ultra-microscopy and nanotechnology. It has also been demonstrated to provide a number of microfluidic functions necessary for miniaturized chromatography. These include injection of sub-femtoliter samples, fluidic switching, and sheardriven pumping. The AFM probe tip can be used to selectively remove surface layers for subsequent microchemical analysis using infrared and tip-enhanced Raman spectroscopy. With its ability to image individual atoms, the AFM is a remarkably sensitive detector that can be used to detect separated components. These diverse functional components of microfluidic manipulation have been combined in this work to demonstrate AFM mediated chromatography. AFM mediated chromatography uses channel-less, shear-driven pumping. This is demonstrated with a thin, aluminum oxide substrate and a non-polar solvent system to separate a mixture of lipophilic dyes. In conventional chromatographic terms, this is analogous to thin-layer chromatography using normal phase alumina substrate with sheardriven pumping provided by the AFM tip-cantilever mechanism. The AFM detection of separated components is accomplished by exploiting the variation in the localized friction of the separated components. The AFM tip-cantilever provides the mechanism for producing shear-induced flows and rapid pumping. Shear-driven chromatography (SDC) is a relatively new concept that overcomes the speed and miniaturization limitations of conventional liquid chromatography. SDC is based on a

  16. Synthesis of nanowires via helium and neon focused ion beam induced deposition with the gas field ion microscope.

    Science.gov (United States)

    Wu, H M; Stern, L A; Chen, J H; Huth, M; Schwalb, C H; Winhold, M; Porrati, F; Gonzalez, C M; Timilsina, R; Rack, P D

    2013-05-03

    The ion beam induced nanoscale synthesis of platinum nanowires using the trimethyl (methylcyclopentadienyl)platinum(IV) (MeCpPt(IV)Me3) precursor is investigated using helium and neon ion beams in the gas field ion microscope. The He(+) beam induced deposition resembles material deposited by electron beam induced deposition with very small platinum nanocrystallites suspended in a carbonaceous matrix. The He(+) deposited material composition was estimated to be 16% Pt in a matrix of amorphous carbon with a large room-temperature resistivity (∼3.5 × 10(4)-2.2 × 10(5) μΩ cm) and temperature-dependent transport behavior consistent with a granular material in the weak intergrain tunnel coupling regime. The Ne(+) deposited material has comparable composition (17%), however a much lower room-temperature resistivity (∼600-3.0 × 10(3) μΩ cm) and temperature-dependent electrical behavior representative of strong intergrain coupling. The Ne(+) deposited nanostructure has larger platinum nanoparticles and is rationalized via Monte Carlo ion-solid simulations which show that the neon energy density deposited during growth is much larger due to the smaller ion range and is dominated by nuclear stopping relative to helium which has a larger range and is dominated by electronic stopping.

  17. Atomic force microscope featuring an integrated optical microscope

    NARCIS (Netherlands)

    Putman, C.A.J.; Putman, Constant A.J.; de Grooth, B.G.; van Hulst, N.F.; Greve, Jan

    1992-01-01

    The atomic force microscope (AFM) is used to image the surface of both conductors and nonconductors. Biological specimens constitute a large group of nonconductors. A disadvantage of most AFM's is the fact that relatively large areas of the sample surface have to be scanned to pinpoint a biological

  18. Creation and recovery of a W(111) single atom gas field ion source.

    Science.gov (United States)

    Pitters, Jason L; Urban, Radovan; Wolkow, Robert A

    2012-04-21

    Tungsten single atom tips have been prepared from a single crystal W(111) oriented wire using the chemical assisted field evaporation and etching method. Etching to a single atom tip occurs through a symmetric structure and leads to a predictable last atom unlike etching with polycrystalline tips. The single atom tip formation procedure is shown in an atom by atom removal process. Rebuilds of single atom tips occur on the same crystalline axis as the original tip such that ion emission emanates along a fixed direction for all tip rebuilds. This preparation method could be utilized and developed to prepare single atom tips for ion source development.

  19. First Atomic Force Microscope Image from Mars

    Science.gov (United States)

    2008-01-01

    This calibration image presents three-dimensional data from the atomic force microscope on NASA's Phoenix Mars Lander, showing surface details of a substrate on the microscope station's sample wheel. It will be used as an aid for interpreting later images that will show shapes of minuscule Martian soil particles. The area imaged by the microscope is 40 microns by 40 microns, small enough to fit on an eyelash. The grooves in this substrate are 14 microns (0.00055 inch) apart, from center to center. The vertical dimension is exaggerated in the image to make surface details more visible. The grooves are 300 nanometers (0.00001 inch) deep. This is the first atomic force microscope image recorded on another planet. It was taken on July 9, 2008, during the 44th Martian day, or sol, of the Phoenix mission since landing. Phoenix's Swiss-made atomic force microscope builds an image of the surface shape of a particle by sensing it with a sharp tip at the end of a spring, all microfabricated out of a silicon wafer. A strain gauge records how far the spring flexes to follow the contour of the surface. It can provide details of soil-particle shapes smaller than one-hundredth the width of a human hair. This is about 20 times smaller than what can be resolved with Phoenix's optical microscope, which has provided much higher-magnification imaging than anything seen on Mars previously. Both microscopes are part of Phoenix's Microscopy, Electrochemistry and Conductivity Analyzer.

  20. A Scanning Quantum Cryogenic Atom Microscope

    CERN Document Server

    Yang, Fan; Taylor, Stephen F; Turner, Richard W; Lev, Benjamin L

    2016-01-01

    Microscopic imaging of local magnetic fields provides a window into the organizing principles of complex and technologically relevant condensed matter materials. However, a wide variety of intriguing strongly correlated and topologically nontrivial materials exhibit poorly understood phenomena outside the detection capability of state-of-the-art high-sensitivity, high-resolution scanning probe magnetometers. We introduce a quantum-noise-limited scanning probe magnetometer that can operate from room-to-cryogenic temperatures with unprecedented DC-field sensitivity and micron-scale resolution. The Scanning Quantum Cryogenic Atom Microscope (SQCRAMscope) employs a magnetically levitated atomic Bose-Einstein condensate (BEC), thereby providing immunity to conductive and blackbody radiative heating. The SQCRAMscope has a noise floor of 300 pT and provides a 100x improvement in magnetic flux sensitivity over previous atomic scanning probe magnetometers. These capabilities are carefully benchmarked by imaging magnet...

  1. US Atom-Resolving Microscope Project

    Energy Technology Data Exchange (ETDEWEB)

    Gronsky, R.

    1980-03-01

    The largest project in transmission electron microscopy in this country has recently been initiated. This project has been given the name Atomic Resolution Microscopy and its goal is to provide the instrumentation and expertise necessary to conduct materials research directly at the atomic level. Taking advantage of the best available technology in electron-optical design, its core instrumentation is a unique machine, the Atomic Resolution Microscope (ARM), which is to be built by commercial manufacturers to the specifications of LBL and used in basic research programs requiring atomic imaging capabilities. The project will also include an in-house instrument development effort to maintain state-of-the-art performance from the ARM. Details of history, organization and performance specifications are given.

  2. Sharp Tips on the Atomic Force Microscope

    Science.gov (United States)

    2008-01-01

    This image shows the eight sharp tips of the NASA's Phoenix Mars Lander's Atomic Force Microscope, or AFM. The AFM is part of Phoenix's Microscopy, Electrochemistry, and Conductivity Analyzer, or MECA. The microscope maps the shape of particles in three dimensions by scanning them with one of the tips at the end of a beam. For the AFM image taken, the tip at the end of the upper right beam was used. The tip pointing up in the enlarged image is the size of a smoke particle at its base, or 2 microns. This image was taken with a scanning electron microscope before Phoenix launched on August 4, 2007. The AFM was developed by a Swiss-led consortium in collaboration with Imperial College London. The Phoenix Mission is led by the University of Arizona, Tucson, on behalf of NASA. Project management of the mission is by NASA's Jet Propulsion Laboratory, Pasadena, Calif. Spacecraft development is by Lockheed Martin Space Systems, Denver.

  3. Atomic Force Microscope for Imaging and Spectroscopy

    Science.gov (United States)

    Pike, W. T.; Hecht, M. H.; Anderson, M. S.; Akiyama, T.; Gautsch, S.; deRooij, N. F.; Staufer, U.; Niedermann, Ph.; Howald, L.; Mueller, D.

    2000-01-01

    We have developed, built, and tested an atomic force microscope (AFM) for extraterrestrial applications incorporating a micromachined tip array to allow for probe replacement. It is part of a microscopy station originally intended for NASA's 2001 Mars lander to identify the size, distribution, and shape of Martian dust and soil particles. As well as imaging topographically down to nanometer resolution, this instrument can be used to reveal chemical information and perform infrared and Raman spectroscopy at unprecedented resolution.

  4. Quantum Gas Microscope for Fermionic Atoms

    Science.gov (United States)

    Okan, Melih; Cheuk, Lawrence; Nichols, Matthew; Lawrence, Katherine; Zhang, Hao; Zwierlein, Martin

    2016-05-01

    Strongly interacting fermions define the properties of complex matter throughout nature, from atomic nuclei and modern solid state materials to neutron stars. Ultracold atomic Fermi gases have emerged as a pristine platform for the study of many-fermion systems. In this poster we demonstrate the realization of a quantum gas microscope for fermionic 40 K atoms trapped in an optical lattice and the recent experiments which allows one to probe strongly correlated fermions at the single atom level. We combine 3D Raman sideband cooling with high- resolution optics to simultaneously cool and image individual atoms with single lattice site resolution at a detection fidelity above 95%. The imaging process leaves the atoms predominantly in the 3D motional ground state of their respective lattice sites, inviting the implementation of a Maxwell's demon to assemble low-entropy many-body states. Single-site resolved imaging of fermions enables the direct observation of magnetic order, time resolved measurements of the spread of particle correlations, and the detection of many-fermion entanglement. NSF, AFOSR-PECASE, AFOSR-MURI on Exotic Phases of Matter, ARO-MURI on Atomtronics, ONR, a Grant from the Army Research Office with funding from the DARPA OLE program, and the David and Lucile Packard Foundation.

  5. Microstructural development in PWA-1480 electron beam welds: An atom probe field ion microscopy study

    Energy Technology Data Exchange (ETDEWEB)

    David, S.A.; Miller, M.K. [Oak Ridge National Lab., TN (United States); Babu, S.S. [The Pennsylvania State Univ., State College, PA (United States)

    1995-12-31

    The microstructure development in PWA-1480 superalloy electron beam weld (Ni-11.0 at. % Al-11.5% Cr-1.9% Ti-5.1% Co-4.0% Ta-1.3% W) was characterized. Optical microscopy revealed a branched dendritic structure in the weld metal. Transmission electron microscopy of these welds, in the as-welded condition, showed fine cuboidal (0.05--0.5 {mu}m) L1{sub 2}-ordered {gamma}{prime} precipitates within the y grains. The average volume percentage of {gamma}{prime} precipitates was found to be {approx}5%. Atom probe analyses revealed that the composition of {gamma} matrix was Ni-4.6 at. % Al-25.5% Cr-0.4% Ti-9.4% Co-0.8% Ta-2.9% W and that of {gamma}{prime} precipitates was Ni-17.3 at. % Al-2.6% Cr-2.4% Ti-3.0% Co-7.4% Ta-1.3% W. These compositions were compared with the previous APFIM analyses of commercial PWA-1480 single crystals that had received conventional heat treatments. Small differences were found in the chromium and aluminum levels and these may be due to the nonequilibrium nature of phase transformations that occur during weld cooling. No solute segregation was detected at the {gamma}-{gamma}{prime}interface. The APFIM results were also compared with the thermodynamic calculations of alloying element partitioning between {gamma} and {gamma}{prime} using the ThermoCalc{trademark} software.

  6. Digital atomic force microscope Moire method

    Energy Technology Data Exchange (ETDEWEB)

    Liu, C.-M. [Department of Mechanical Engineering, National Cheng Kung University, Tainan 70101, Taiwan (China); Chen, L.-W. [Department of Mechanical Engineering, National Cheng Kung University, Tainan 70101, Taiwan (China)]. E-mail: chenlw@mail.ncku.edu.tw

    2004-11-15

    In this study, a novel digital atomic force microscope (AFM) moire method is established to measure the displacement and strain fields. The moire pattern is generated by the interference between the specimen grating and the virtual reference grating formed by digital image processes. The overlapped image is filtered by the 2-D wavelet transformation to obtain clear interference moire patterns. From moire patterns, the displacement and strain fields can be analyzed. The experimental results show that the digital AFM moire method is very sensitive and easy to realize in nanoscale measurements.

  7. Calibrated atomic force microscope measurements of vickers hardness indentations and tip production and characterisation for scanning tunelling microscope

    DEFF Research Database (Denmark)

    Jensen, Carsten P.

    Calibrated atomic force microscope measurements of vickers hardness indentations and tip production and characterisation for scanning tunelling microscope......Calibrated atomic force microscope measurements of vickers hardness indentations and tip production and characterisation for scanning tunelling microscope...

  8. Calibrated atomic force microscope measurements of vickers hardness indentations and tip production and characterisation for scanning tunelling microscope

    DEFF Research Database (Denmark)

    Jensen, Carsten P.

    Calibrated atomic force microscope measurements of vickers hardness indentations and tip production and characterisation for scanning tunelling microscope......Calibrated atomic force microscope measurements of vickers hardness indentations and tip production and characterisation for scanning tunelling microscope...

  9. Polymerized LB Films Imaged with a Combined Atomic Force Microscope-Fluorescence Microscope

    NARCIS (Netherlands)

    Putman, C.A.J.; Putman, Constant A.J.; Hansma, Helen G.; Gaub, Hermann E.; Hansma, Paul K.

    1992-01-01

    The first results obtained with a new stand-alone atomic force microscope (AFM) integrated with a standard Zeiss optical fluorescence microscope are presented. The optical microscope allows location and selection of objects to be imaged with the high-resolution AFM. Furthermore, the combined

  10. Polymerized LB films imaged with a combined atomic force microscope-fluorescence microscope

    NARCIS (Netherlands)

    Putman, Constant A.J.; Hansma, Helen G.; Gaub, Hermann E.; Hansma, Paul K.

    1992-01-01

    The first results obtained with a new stand-alone atomic force microscope (AFM) integrated with a standard Zeiss optical fluorescence microscope are presented. The optical microscope allows location and selection of objects to be imaged with the high-resolution AFM. Furthermore, the combined microsc

  11. Atomic force microscope with integrated optical microscope for biological applications

    NARCIS (Netherlands)

    Putman, Constant A.J.; Putman, C.A.J.; van der Werf, Kees; de Grooth, B.G.; van Hulst, N.F.; Segerink, Franciscus B.; Greve, Jan

    1992-01-01

    Since atomic force microscopy (AFM) is capable of imaging nonconducting surfaces, the technique holds great promises for high‐resolution imaging of biological specimens. A disadvantage of most AFMs is the fact that the relatively large sample surface has to be scanned multiple times to pinpoint a

  12. Atomic and molecular manipulation with the scanning tunneling microscope.

    Science.gov (United States)

    Stroscio, J A; Eigler, D M

    1991-11-29

    The prospect of manipulating matter on the atomic scale has fascinated scientists for decades. This fascination may be motivated by scientific and technological opportunities, or from a curiosity about the consequences of being able to place atoms in a particular location. Advances in scanning tunneling microscopy have made this prospect a reality; single atoms can be placed at selected positions and structures can be built to a particular design atom-by-atom. Atoms and molecules may be manipulated in a variety of ways by using the interactions present in the tunnel junction of a scanning tunneling microscope. Some of these recent developments and some of the possible uses of atomic and molecular manipulation as a tool for science are discussed.

  13. Controlled manipulation of nanoparticles with an atomic force microscope

    Science.gov (United States)

    Junno, T.; Deppert, K.; Montelius, L.; Samuelson, L.

    1995-06-01

    We report on the application of the atomic force microscope (AFM) to manipulate and position nanometer-sized particles with nanometer precision. The technique, which can be regarded as a nanometer-scale analogy to atomic level manipulation with the scanning tunneling microscope, allowed us to form arbitrary nanostructures, under ambient conditions, by controlled manipulation of individual 30 nm GaAs particles. A whole new set of nanodevices can be fabricated particle-by-particle for studies of quantum effects and single electron tunneling. We also demonstrate a method, based on the AFM manipulation, to determine the true lateral dimensions of nano-objects, in spite of the tip-sample convolution.

  14. Measuring Forces between Oxide Surfaces Using the Atomic Force Microscope

    DEFF Research Database (Denmark)

    Pedersen, Henrik Guldberg; Høj, Jakob Weiland

    1996-01-01

    The interactions between colloidal particles play a major role in processing of ceramics, especially in casting processes. With the Atomic Force Microscope (AFM) it is possible to measure the inter-action force between a small oxide particle (a few micron) and a surface as function of surface sep...

  15. Measuring Forces between Oxide Surfaces Using the Atomic Force Microscope

    DEFF Research Database (Denmark)

    Pedersen, Henrik Guldberg; Høj, Jakob Weiland

    1996-01-01

    The interactions between colloidal particles play a major role in processing of ceramics, especially in casting processes. With the Atomic Force Microscope (AFM) it is possible to measure the inter-action force between a small oxide particle (a few micron) and a surface as function of surface...

  16. New approaches to atomic force microscope lithography on silicon

    DEFF Research Database (Denmark)

    Birkelund, Karen; Thomsen, Erik Vilain; Rasmussen, Jan Pihl

    1997-01-01

    We have investigated new approaches to the formation of conducting nanowires on crystalline silicon surfaces using atomic force microscope (AFM) lithography. To increase processing speed and reduce wear of the AFM tip, large-scale structures are formed with a direct laser write setup, while the AFM...

  17. Fabrication of an all-metal atomic force microscope probe

    DEFF Research Database (Denmark)

    Rasmussen, Jan Pihl; Tang, Peter Torben; Hansen, Ole

    1997-01-01

    This paper presents a method for fabrication of an all-metal atomic force microscope probe (tip, cantilever and support) for optical read-out, using a combination of silicon micro-machining and electroforming. The paper describes the entire fabrication process for a nickel AFM-probe. In addition...

  18. Atomic force microscope characterization of a resonating nanocantilever

    DEFF Research Database (Denmark)

    Abadal, G.; Davis, Zachary James; Borrise, X.

    2003-01-01

    An atomic force microscope (AFM) is used as a nanometer-scale resolution tool for the characterization of the electromechanical behaviour of a resonant cantilever-based mass sensor. The cantilever is actuated electrostatically by applying DC and AC voltages from a driver electrode placed closely...

  19. Stitching Grid-wise Atomic Force Microscope Images

    DEFF Research Database (Denmark)

    Vestergaard, Mathias Zacho; Bengtson, Stefan Hein; Pedersen, Malte

    2016-01-01

    Atomic Force Microscopes (AFM) are able to capture images with a resolution in the nano metre scale. Due to this high resolution, the covered area per image is relatively small, which can be problematic when surveying a sample. A system able to stitch AFM images has been developed to solve...

  20. Stitching Grid-wise Atomic Force Microscope Images

    DEFF Research Database (Denmark)

    Vestergaard, Mathias Zacho; Bengtson, Stefan Hein; Pedersen, Malte

    2016-01-01

    Atomic Force Microscopes (AFM) are able to capture images with a resolution in the nano metre scale. Due to this high resolution, the covered area per image is relatively small, which can be problematic when surveying a sample. A system able to stitch AFM images has been developed to solve this p...

  1. Resonant difference-frequency atomic force ultrasonic microscope

    Science.gov (United States)

    Cantrell, John H. (Inventor); Cantrell, Sean A. (Inventor)

    2010-01-01

    A scanning probe microscope and methodology called resonant difference-frequency atomic force ultrasonic microscopy (RDF-AFUM), employs an ultrasonic wave launched from the bottom of a sample while the cantilever of an atomic force microscope, driven at a frequency differing from the ultrasonic frequency by one of the contact resonance frequencies of the cantilever, engages the sample top surface. The nonlinear mixing of the oscillating cantilever and the ultrasonic wave in the region defined by the cantilever tip-sample surface interaction force generates difference-frequency oscillations at the cantilever contact resonance. The resonance-enhanced difference-frequency signals are used to create images of nanoscale near-surface and subsurface features.

  2. Arrays of microscopic magnetic traps for cold atoms and their applications in atom optics

    Institute of Scientific and Technical Information of China (English)

    印建平; 高伟建; 胡建军

    2002-01-01

    A single microscopic magnetic trap for neutral atoms using planar current-carrying wires was proposed and studiedtheoretically by Weinstein et al. In this paper, we propose three structures of composite current-carrying wires to provide1D, 2D and 3D arrays of microscopic magnetic traps for cold alkali atoms. The spatial distributions of magnetic fieldsgenerated by these structures are calculated and the field gradient and curvature in each single microtrap are analysed.Our study shows that arrays of microscopic magnetic traps can be used to provide 1D, 2D or 3D atomic magneticlattices, and even to realize 1D, 2D and 3D arrays of magneto-optical traps, and so on.

  3. MIDAS: Lessons learned from the first spaceborne atomic force microscope

    CERN Document Server

    Bentley, Mark S; Butler, Bart; Gavira, Jose; Jeszenszky, Harald; Mannel, Thurid; Romstedt, Jens; Schmied, Roland; Torkar, Klaus

    2016-01-01

    The Micro-Imaging Dust Analysis System (MIDAS) atomic force microscope (AFM) onboard the Rosetta orbiter was the first such instrument launched into space in 2004. Designed only a few years after the technique was invented, MIDAS is currently orbiting comet 67P Churyumov-Gerasimenko and producing the highest resolution 3D images of cometary dust ever made in situ. After more than a year of continuous operation much experience has been gained with this novel instrument. Coupled with operations of the Flight Spare and advances in terrestrial AFM a set of "lessons learned" has been produced, cumulating in recommendations for future spaceborne atomic force microscopes. The majority of the design could be reused as-is, or with incremental upgrades to include more modern components (e.g. the processor). Key additional recommendations are to incorporate an optical microscope to aid the search for particles and image registration, to include a variety of cantilevers (with different spring constants) and a variety of ...

  4. Nonlinear control techniques for an atomic force microscope system

    Institute of Scientific and Technical Information of China (English)

    Yongchun FANG; Matthew FEEMSTER; Darren DAWSON; Nader M.JALILI

    2005-01-01

    Two nonlinear control techniques are proposed for an atomic force microscope system.Initially,a learning-based control algorithm is developed for the microcantilever-sample system that achieves asymptotic cantilever tip tracking for periodic trajectories.Specifically,the control approach utilizes a learning-based feedforward term to compensate for periodic dynamics and high-gain terms to account for non-periodic dynamics.An adaptive control algorithm is then developed to achieve asymptotic cantilever tip tracking for bounded tip trajectories despite uncertainty throughout the system parameters.Simulation results are provided to illustrate the efficacy and performance of the control strategies.

  5. Imaging using lateral bending modes of atomic force microscope cantilevers

    Science.gov (United States)

    Caron, A.; Rabe, U.; Reinstädtler, M.; Turner, J. A.; Arnold, W.

    2004-12-01

    Using scanning probe techniques, surface properties such as shear stiffness and friction can be measured with a resolution in the nanometer range. The torsional deflection or buckling of atomic force microscope cantilevers has previously been used in order to measure the lateral forces acting on the tip. This letter shows that the flexural vibration modes of cantilevers oscillating in their width direction parallel to the sample surface can also be used for imaging. These lateral cantilever modes exhibit vertical deflection amplitudes if the cantilever is asymmetric in thickness direction, e.g., by a trapezoidal cross section.

  6. Fabrication of Josephson junctions by using an atomic force microscope

    CERN Document Server

    Song, I S; Kim, D H; Park, G S

    2000-01-01

    Josephson junctions have been fabricated by using an atomic foce microscope (AFM) for surface modification. YBCO films were fabricated on MgO substrates by using pulsed laser deposition. Surface modification of YBCO strips in the field of conductive AFM tips results in controlled and systematic growth of protrusions across the entire strip. Increasing the negative bias voltage to the AFM tip linearly increases the size of the modified structures. The offset superconducting transition temperature and the critical current values systematically shift to lower temperature and current values with increasing degree of AFM modification.

  7. Fabrication method for microscopic vapor cells for alkali atoms.

    Science.gov (United States)

    Baluktsian, T; Urban, C; Bublat, T; Giessen, H; Löw, R; Pfau, T

    2010-06-15

    A quantum network that consists of several components should ideally work on a single physical platform. Neutral alkali atoms have the potential to be very well suited for this purpose due to their electronic structure, which involves long-lived nuclear spins and very sensitive highly excited Rydberg states. In this Letter, we describe a fabrication method based on quartz glass to structure arbitrary shapes of microscopic vapor cells. We show that the usual spectroscopic properties known from macroscopic vapor cells are almost unaffected by the strong confinement.

  8. Scanned-cantilever atomic force microscope with large scanning range

    Institute of Scientific and Technical Information of China (English)

    Jintao Yang; Wendong Xu

    2006-01-01

    A scanned-cantilever atomic force microscope (AFM) with large scanning range is proposed, which adopts a new design named laser spot tracking. The scanned-cantilever AFM uses the separate flexure x-y scanner and z scanner instead of the conventional piezoelectric tube scanner. The closed-loop control and integrated capacitive sensors of these scanners can insure that the images of samples have excellent linearity and stability. According to the experimental results, the scanned-cantilever AFM can realize maximal 100 × 100 (μm) scanning range, and 1-nm resolution in z direction, which can meet the requirements of large scale sample testing.

  9. Direct observation of uncoated spectrin with atomic force microscope

    Institute of Scientific and Technical Information of China (English)

    张平城; 白春礼; 成英俊; 方晔; 冯立明; 潘华珍

    1996-01-01

    Spectrin molecules extracted from human blood ceil membrane have been examined by atomic force microscopy (AFM) without using shadowing or staining procedures. A drop of the solution containing spectrin molecules was deposited on the freshly deaved mica substrate. After about 1 min, the residual solution was removed with a piece of filter paper. Afterwards the sample was imaged with a home-made atomic force microscope (AFM) in air in a constant force mode. The obtained AFM images revealed that the spectrin molecules prepared from the above procedures exhibit several kinds of structures as follows: (i) the compact rod-like spectrin heterodimers with a length of around 100 nm; (ii) bent or curved linear tetramers with a length of around 200 nm; (iii) somewhat curved spectrin hexamers, octomers or decamers with lengths of about 300, 400, or 500 nm; and (iv) high oligomers with a length above 1 000 nm.

  10. Interlaboratory comparison of traceable atomic force microscope pitch measurements

    Science.gov (United States)

    Dixson, Ronald; Chernoff, Donald A.; Wang, Shihua; Vorburger, Theodore V.; Tan, Siew Leng; Orji, Ndubuisi G.; Fu, Joseph

    2010-06-01

    The National Institute of Standards and Technology (NIST), Advanced Surface Microscopy (ASM), and the National Metrology Centre (NMC) of the Agency for Science, Technology, and Research (A*STAR) in Singapore have completed a three-way interlaboratory comparison of traceable pitch measurements using atomic force microscopy (AFM). The specimen being used for this comparison is provided by ASM and consists of SiO2 lines having a 70 nm pitch patterned on a silicon substrate. NIST has a multifaceted program in atomic force microscope (AFM) dimensional metrology. One component of this effort is a custom in-house metrology AFM, called the calibrated AFM (C-AFM). The NIST C-AFM has displacement metrology for all three axes traceable to the 633 nm wavelength of the iodine-stabilized He-Ne laser - a recommended wavelength for realization of the SI (Système International d'Unités, or International System of Units) meter. NIST used the C-AFM to participate in this comparison. ASM used a commercially available AFM with an open-loop scanner, calibrated by a 144 nm pitch transfer standard. In a prior collaboration with Physikalisch-Technische Bundesanstalt (PTB), the German national metrology institute, ASM's transfer standard was calibrated using PTB's traceable optical diffractometry instrument. Thus, ASM's measurements are also traceable to the SI meter. NMC/A*STAR used a large scanning range metrological atomic force microscope (LRM-AFM). The LRM-AFM integrates an AFM scanning head into a nano-stage equipped with three built-in He-Ne laser interferometers so that its measurement related to the motion on all three axes is directly traceable to the SI meter. The measurements for this interlaboratory comparison have been completed and the results are in agreement within their expanded uncertainties and at the level of a few parts in 104.

  11. Digital phase-shifting atomic force microscope Moire method

    Energy Technology Data Exchange (ETDEWEB)

    Liu Chiaming; Chen Lienwen [Department of Mechanical Engineering, National Cheng Kung University, Tainan, Taiwan, 70101 (China)

    2005-04-21

    In this study, the digital atomic force microscope (AFM) Moire method with phase-shifting technology is established to measure the in-plane displacement and strain fields. The Moire pattern is generated by the interference between the specimen grating and the virtual reference grating formed by digital image processes. The overlapped image is filtered by two-dimensional wavelet transformation to obtain the clear interference Moire patterns. The four-step phase-shifting method is realized by translating the phase of the virtual reference grating from 0 to 2{pi}. The principle of the digital AFM Moire method and the phase-shifting technology are described in detail. Experimental results show that this method is convenient to use and efficient in realizing the microscale measurement.

  12. Edge Effects and Coupling Effects in Atomic Force Microscope Images

    Institute of Scientific and Technical Information of China (English)

    ZHANGXiang-jun; MENGYong-gang; WENShi-zhu

    2004-01-01

    The AFM images were obtained by an atomic force microscope (AFM) and transformed from the deformation of AFM micro cantilever probe. However, due to the surface topography and surface forces applied on the AFM tip of sample, the deformation of AFM probe results in obvious edge effects and coupling effects in the AFM images. The deformation of AFM probe was analyzed,the mechanism of the edge effects and the coupling effects was investigated, and their results in the AFM images were studied. It is demanstrated by the theoretical analysis and AFM experiments that the edge effects make lateral force images more clear than the topography images, also make extraction of frictional force force from lateral force images mare complex and difficult. While the coupling effects make the comparison between topography images and lateral force images mare advantage to acquire precise topography information by AFM.

  13. Atomic force microscope based on vertical silicon probes

    Science.gov (United States)

    Walter, Benjamin; Mairiaux, Estelle; Faucher, Marc

    2017-06-01

    A family of silicon micro-sensors for Atomic Force Microscope (AFM) is presented that allows to operate with integrated transducers from medium to high frequencies together with moderate stiffness constants. The sensors are based on Micro-Electro-Mechanical-Systems technology. The vertical design specifically enables a long tip to oscillate perpendicularly to the surface to be imaged. The tip is part of a resonator including quasi-flexural composite beams, and symmetrical transducers that can be used as piezoresistive detector and/or electro-thermal actuator. Two vertical probes (Vprobes) were operated up to 4.3 MHz with stiffness constants 150 N/m to 500 N/m and the capability to oscillate from 10 pm to 90 nm. AFM images of several samples both in amplitude modulation (tapping-mode) and in frequency modulation were obtained.

  14. A subsurface add-on for standard atomic force microscopes.

    Science.gov (United States)

    Verbiest, G J; van der Zalm, D J; Oosterkamp, T H; Rost, M J

    2015-03-01

    The application of ultrasound in an Atomic Force Microscope (AFM) gives access to subsurface information. However, no commercially AFM exists that is equipped with this technique. The main problems are the electronic crosstalk in the AFM setup and the insufficiently strong excitation of the cantilever at ultrasonic (MHz) frequencies. In this paper, we describe the development of an add-on that provides a solution to these problems by using a special piezo element with a lowest resonance frequency of 2.5 MHz and by separating the electronic connection for this high frequency piezo element from all other connections. In this sense, we support researches with the possibility to perform subsurface measurements with their existing AFMs and hopefully pave also the way for the development of a commercial AFM that is capable of imaging subsurface features with nanometer resolution.

  15. A subsurface add-on for standard atomic force microscopes

    Energy Technology Data Exchange (ETDEWEB)

    Verbiest, G. J., E-mail: Verbiest@physik.rwth-aachen.de [JARA-FIT and II. Institute of Physics, RWTH Aachen University, 52074 Aachen (Germany); Zalm, D. J. van der; Oosterkamp, T. H.; Rost, M. J., E-mail: Rost@physics.leidenuniv.nl [Kamerlingh Onnes Laboratory, Leiden University, P.O. Box 9504, 2300 RA Leiden (Netherlands)

    2015-03-15

    The application of ultrasound in an Atomic Force Microscope (AFM) gives access to subsurface information. However, no commercially AFM exists that is equipped with this technique. The main problems are the electronic crosstalk in the AFM setup and the insufficiently strong excitation of the cantilever at ultrasonic (MHz) frequencies. In this paper, we describe the development of an add-on that provides a solution to these problems by using a special piezo element with a lowest resonance frequency of 2.5 MHz and by separating the electronic connection for this high frequency piezo element from all other connections. In this sense, we support researches with the possibility to perform subsurface measurements with their existing AFMs and hopefully pave also the way for the development of a commercial AFM that is capable of imaging subsurface features with nanometer resolution.

  16. A Conceptual Atomic Force Microscope using LEGO for Nanoscience Education

    Directory of Open Access Journals (Sweden)

    Tsung-Han Hsieh

    2014-05-01

    Full Text Available A lack of effective educational materials is limited general public awareness of, and interest in, nanoscience. This paper presents a conceptual atomic force microscope (AFM model built by using the LEGO® MINDSTORMS series. AFMs are perhaps one of the most fundamental and widely-used instruments in nanoscience and nanotechnology, thus the introduction of this LEGO® AFM should be beneficial to nanoscience education. Programmed in LabVIEW, this LEGO® model has the ability to scan the samples and construct a three-dimensional (3D surface graphs of the sample, based on the mechanism used for AFM. With this LEGO® AFM, the students can directly access nanoscience concepts through hands-on experience constructing an AFM model. This interaction will lead to a better understanding of nanoscience principles, and motivate learners to further explore both the theoretical and experimental aspects of the domain.

  17. Atomic force microscope chamber for in situ studies of ice

    Science.gov (United States)

    Zepeda, Salvador; Yeh, Yin; Orme, Christine A.

    2001-11-01

    To investigate the surface morphologies of biological systems in a controlled gaseous environment (e.g., the temperature, humidity and composition), most commercial atomic force microscopes require modification. We have designed a double-jacketed environmental chamber specifically for a Nanoscope IIIa (Digital Instruments, Santa Barbara, CA) force microscope. We use cold nitrogen and thermoelectric devices to control the temperature in the chamber; the nitrogen simultaneously serves to create an inert environment. We have also designed a temperature controlled sample stage utilizing thermoelectric devices for fine temperature regulation. A variation of this sample stage allows us to image samples in fluids at cold temperatures with an O-ringless configuration. The relative humidity within the chamber is also measured with commercially available relative humidity sensors. We investigate the surface morphology of ice Ih in its pure phase and shall extend the study to ice in the presence of biological molecules, such as antifreeze proteins. We present a detailed description of our design and our first images of polycrystalline ice and single crystals of ice grown in situ from the vapor.

  18. From atoms to steps: The microscopic origins of crystal evolution

    Science.gov (United States)

    Patrone, Paul N.; Einstein, T. L.; Margetis, Dionisios

    2014-07-01

    The Burton-Cabrera-Frank (BCF) theory of crystal growth has been successful in describing a wide range of phenomena in surface physics. Typical crystal surfaces are slightly misoriented with respect to a facet plane; thus, the BCF theory views such systems as composed of staircase-like structures of steps separating terraces. Adsorbed atoms (adatoms), which are represented by a continuous density, diffuse on terraces, and steps move by absorbing or emitting these adatoms. Here we shed light on the microscopic origins of the BCF theory by deriving a simple, one-dimensional (1D) version of the theory from an atomistic, kinetic restricted solid-on-solid (KRSOS) model without external material deposition. We define the time-dependent adatom density and step position as appropriate ensemble averages in the KRSOS model, thereby exposing the non-equilibrium statistical mechanics origins of the BCF theory. Our analysis reveals that the BCF theory is valid in a low adatom-density regime, much in the same way that an ideal gas approximation applies to dilute gasses. We find conditions under which the surface remains in a low-density regime and discuss the microscopic origin of corrections to the BCF model.

  19. z calibration of the atomic force microscope by means of a pyramidal tip

    DEFF Research Database (Denmark)

    Jensen, Flemming

    1993-01-01

    A new method for imaging the probe tip of an atomic force microscope cantilever by the atomic force microscope itself (self-imaging) is presented. The self-imaging is accomplished by scanning the probe tip across a sharper tip on the surface. By using a pyramidal probe tip with a very well......-defined aspect ratio, this technique provides an excellent z-calibration standard for the atomic force microscope....

  20. Investigation of structural change of purple membrane in storage by transmission electron microscope and atomic force microscope

    Institute of Scientific and Technical Information of China (English)

    2001-01-01

    The structural change of purple membrane during storage has been investigated by means of transmission electron microscope and atomic force microscope. It is found that many liposomes have spontaneously evolved from the purple membrane sheets isolated three years ago. The membrane proteins on the liposomes, bacteriorhodopsin, are still presented as trimers in 2-D hexagonal structure, which is the same as that in natural cell membrane. However, the cytoplasmic surface of purple membrane faced outside on the liposomes.

  1. Contact resonances of U-shaped atomic force microscope probes

    Energy Technology Data Exchange (ETDEWEB)

    Rezaei, E.; Turner, J. A., E-mail: jaturner@unl.edu [Mechanical and Materials Engineering, University of Nebraska-Lincoln, W342 Nebraska Hall, Lincoln, Nebraska 68588 (United States)

    2016-01-21

    Recent approaches used to characterize the elastic or viscoelastic properties of materials with nanoscale resolution have focused on the contact resonances of atomic force microscope (CR-AFM) probes. The experiments for these CR-AFM methods involve measurement of several contact resonances from which the resonant frequency and peak width are found. The contact resonance values are then compared with the noncontact values in order for the sample properties to be evaluated. The data analysis requires vibration models associated with the probe during contact in order for the beam response to be deconvolved from the measured spectra. To date, the majority of CR-AFM research has used rectangular probes that have a relatively simple vibration response. Recently, U-shaped AFM probes have created much interest because they allow local sample heating. However, the vibration response of these probes is much more complex such that CR-AFM is still in its infancy. In this article, a simplified analytical model of U-shaped probes is evaluated for contact resonance applications relative to a more complex finite element (FE) computational model. The tip-sample contact is modeled using three orthogonal Kelvin-Voigt elements such that the resonant frequency and peak width of each mode are functions of the contact conditions. For the purely elastic case, the frequency results of the simple model are within 8% of the FE model for the lowest six modes over a wide range of contact stiffness values. Results for the viscoelastic contact problem for which the quality factor of the lowest six modes is compared show agreement to within 13%. These results suggest that this simple model can be used effectively to evaluate CR-AFM experimental results during AFM scanning such that quantitative mapping of viscoelastic properties may be possible using U-shaped probes.

  2. Single-atom manipulations in a microscopic dipole trap.

    Science.gov (United States)

    Reymond, Georges; Schlosser, Nicolas; Protsenko, Igor; Grangier, Philippe

    2003-07-15

    We have realized a very small optical dipole trap that is designed to store and manipulate individual atoms. Due to the very small dipole-trap volume, a 'collisional blockade' mechanism locks the average number of trapped atoms at a value of 0.5 over a large range of loading rates. Here we describe methods to characterize the motion of a single trapped atom, and we also demonstrate the possibility of trapping two atoms individually at a short distance apart. Finally, we study theoretically the possibility to perform 'conditional quantum logic' by scattering photons from two such atoms.

  3. Building a Single Atom Microscope for Nuclear Astrophysics

    Science.gov (United States)

    Frisbie, Dustin; Johnson, Maegan; Parzuchowski, Kristen; Wenzl, Jennifer; Singh, Jaideep

    2017-01-01

    The primary research goal of this project is to develop a new technique of optical single atom detection to measure rare nuclear reactions at low energies. The 22Ne(α, n)25Mg reaction is of particular interest, as it is thought to be a primary source of neutrons in the s-process of massive stars. Nuclear reaction products are captured in a cryogenically frozen film of noble gas, which can contain a variety of guest atoms. These solids are ideal to use because they are optically transparent and simple to grow and purify. The sample is illuminated by laser light and imaged to identify fluorescing atoms. The atomic transitions of captured atoms indicate which atoms are present; only atoms which are excited at the laser wavelength will fluoresce. This offers high selectivity during experiments. We began development with Yb, a very bright guest atom, being embedded in a host of solid neon in order to study the optical properties necessary for single atom detection. In addition, we study background effects from the laser exciting contaminants in our substrates. We present data that indicates the efficiency with which we can excite and collect fluorescence light with our apparatus, and use it to propose a strategy for the development of Mg single atom detection. This work is generously supported by Michigan State University.

  4. A variable-temperature nanostencil compatible with a low-temperature scanning tunneling microscope/atomic force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Steurer, Wolfram, E-mail: wst@zurich.ibm.com; Gross, Leo; Schlittler, Reto R.; Meyer, Gerhard [IBM Research-Zurich, 8803 Rüschlikon (Switzerland)

    2014-02-15

    We describe a nanostencil lithography tool capable of operating at variable temperatures down to 30 K. The setup is compatible with a combined low-temperature scanning tunneling microscope/atomic force microscope located within the same ultra-high-vacuum apparatus. The lateral movement capability of the mask allows the patterning of complex structures. To demonstrate operational functionality of the tool and estimate temperature drift and blurring, we fabricated LiF and NaCl nanostructures on Cu(111) at 77 K.

  5. A Cost-Effective Atomic Force Microscope for Undergraduate Control Laboratories

    Science.gov (United States)

    Jones, C. N.; Goncalves, J.

    2010-01-01

    This paper presents a simple, cost-effective and robust atomic force microscope (AFM), which has been purposely designed and built for use as a teaching aid in undergraduate controls labs. The guiding design principle is to have all components be open and visible to the students, so the inner functioning of the microscope has been made clear to…

  6. A Cost-Effective Atomic Force Microscope for Undergraduate Control Laboratories

    Science.gov (United States)

    Jones, C. N.; Goncalves, J.

    2010-01-01

    This paper presents a simple, cost-effective and robust atomic force microscope (AFM), which has been purposely designed and built for use as a teaching aid in undergraduate controls labs. The guiding design principle is to have all components be open and visible to the students, so the inner functioning of the microscope has been made clear to…

  7. Cold atoms in microscopic traps from wires to chips

    CERN Document Server

    Cassettari, D

    2000-01-01

    Ioffe-Pritchard trap. In the latter we have achieved the trapping parameters required in the experiments with Bose-Einstein condensates with much reduced power consumption. In a second time we have replaced the free standing wires with an atom chip, which we have used to compress the atomic cloud in potentials with trap frequencies above 100 kHz and ground state sizes below 100 nm. Such potentials are especially interesting for quantum information proposals of performing quantum gate operations with controlled collisions between trapped atoms. Finally, by combining two wire guides we have experimentally realized an innovative kind of beam splitter for guided atoms. We have investigated the splitting potential generated by a Y-shaped wire which has one input, i.e. the central arm of the Y, and two outputs corresponding to the left and right arms of the Y. By tuning the current ratio in the two outputs we have observed atoms switching from left to right as well as symmetric splitting. This and other similar des...

  8. Atomic-scale studies of impurities in superconductors with a scanning tunneling microscope

    Energy Technology Data Exchange (ETDEWEB)

    Yazdani, A. [Illinois Univ., Urbana, IL (United States). Dept. of Physics and Materials Research Lab.

    2001-04-01

    Imaging and spectroscopy with a cryogenic scanning tunneling microscope (STM) have been used to study the local variation of electronic states on the atomic scale in both low-T{sub c} and high-T{sub c} superconductors. These experiments provide an atomic-scale perspective of impurity scattering by directly probing the localized excitations that are induced by individual impurities. (orig.)

  9. Development of the Atomic-Resolution Environmental Transmission Electron Microscope

    DEFF Research Database (Denmark)

    2016-01-01

    is described. Applications of the ETEM include investigations of catalytic reactions such as biofuel synthesis from biomass, hydrogenation reactions of interest in synthetic fuel cell technologies, and hydrocarbon oxidation along with various other mainly supported metal catalysts. In other fields, the ETEM...... is used to study steels, graphene, nanowires, etc. In this chapter, the experimental setup of the microscope column and its peripherals are described....

  10. Two-probe atomic-force microscope manipulator and its applications.

    Science.gov (United States)

    Zhukov, A A; Stolyarov, V S; Kononenko, O V

    2017-06-01

    We report on a manipulator based on a two-probe atomic force microscope (AFM) with an individual feedback system for each probe. This manipulator works under an upright optical microscope with 3 mm focal distance. The design of the microscope helps us tomanipulate nanowires using the microscope probes as a two-prong fork. The AFM feedback is realized based on the dynamic full-time contact mode. The applications of the manipulator and advantages of its two-probe design are presented.

  11. Macroscopic irreversibility and microscopic paradox: A Constructal law analysis of atoms as open systems

    Science.gov (United States)

    Lucia, Umberto

    2016-10-01

    The relation between macroscopic irreversibility and microscopic reversibility is a present unsolved problem. Constructal law is introduced to develop analytically the Einstein’s, Schrödinger’s, and Gibbs’ considerations on the interaction between particles and thermal radiation (photons). The result leads to consider the atoms and molecules as open systems in continuous interaction with flows of photons from their surroundings. The consequent result is that, in any atomic transition, the energy related to the microscopic irreversibility is negligible, while when a great number of atoms (of the order of Avogadro’s number) is considered, this energy related to irreversibility becomes so large that its order of magnitude must be taken into account. Consequently, macroscopic irreversibility results related to microscopic irreversibility by flows of photons and amount of atoms involved in the processes.

  12. Atomic force microscope study of three-dimensional nanostructure sidewalls

    Energy Technology Data Exchange (ETDEWEB)

    Hussain, Muhammad Mustafa [SEMATECH, 2706 Montopolis Drive, Austin, TX 78741 (United States); Gondran, Carolyn F H [Advanced Technology Development Facility, 2706 Montopolis Drive, Austin, TX 78741 (United States); Michelson, Diane K [International SEMATECH Manufacturing Initiative, 2706 Montopolis Drive, Austin, TX 78741 (United States)

    2007-08-22

    Next generation planar and non-planar complementary metal oxide semiconductor (CMOS) structures are three-dimensional nanostructures with multi-layer stacks that can contain films thinner than ten atomic layers. The high resolution of transmission electron microscopy (TEM) is typically chosen for studying properties of these stacks such as film thickness, interface and interfacial roughness. However, TEM sample preparation is time-consuming and destructive, and TEM analysis is expensive and can provide problematic results for surface and interface roughness. Therefore, in this paper, we present the use of direct measurements of sidewall surface structures by conventional atomic force microscopy (AFM) as an alternative or complementary method for studying multi-layer film stacks and as the preferred method for studying FinFET sidewall surface roughness. In addition to these semiconductor device applications, this AFM sidewall measurement technique could be used for other three-dimensional nanostructures.

  13. Microscopic Lensing by a Dense, Cold Atomic Sample

    CERN Document Server

    Roof, Stetson; Havey, Mark; Sokolov, I M; Kupriyanov, D V

    2014-01-01

    We demonstrate that a cold, dense sample of 87Rb atoms can exhibit a micron-scale lensing effect, much like that associated with a macroscopically-sized lens. The experiment is carried out in the fashion of traditional z-scan measurements but in much weaker fields and where close attention is paid to the detuning dependence of the transmitted light. The results are interpreted using numerical simulations and by modeling the sample as a thin lens with a spherical focal length.

  14. Model based control of dynamic atomic force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Lee, Chibum [Department of Mechanical System Design Engineering, Seoul National University of Science and Technology, Seoul 139-743 (Korea, Republic of); Salapaka, Srinivasa M., E-mail: salapaka@illinois.edu [Department of Mechanical Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801 (United States)

    2015-04-15

    A model-based robust control approach is proposed that significantly improves imaging bandwidth for the dynamic mode atomic force microscopy. A model for cantilever oscillation amplitude and phase dynamics is derived and used for the control design. In particular, the control design is based on a linearized model and robust H{sub ∞} control theory. This design yields a significant improvement when compared to the conventional proportional-integral designs and verified by experiments.

  15. Model based control of dynamic atomic force microscope.

    Science.gov (United States)

    Lee, Chibum; Salapaka, Srinivasa M

    2015-04-01

    A model-based robust control approach is proposed that significantly improves imaging bandwidth for the dynamic mode atomic force microscopy. A model for cantilever oscillation amplitude and phase dynamics is derived and used for the control design. In particular, the control design is based on a linearized model and robust H(∞) control theory. This design yields a significant improvement when compared to the conventional proportional-integral designs and verified by experiments.

  16. Photothermal excitation setup for a modified commercial atomic force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Adam, Holger; Rode, Sebastian; Schreiber, Martin; Kühnle, Angelika, E-mail: kuehnle@uni-mainz.de [Institute of Physical Chemistry, Johannes Gutenberg University Mainz, Duesbergweg 10-14, 55099 Mainz (Germany); Kobayashi, Kei; Yamada, Hirofumi [Department of Electronic Science and Engineering, Kyoto University, Katsura, Nishikyo, Kyoto 615-8510 (Japan)

    2014-02-15

    High-resolution imaging in liquids using frequency modulation atomic force microscopy is known to suffer from additional peaks in the resonance spectrum that are unrelated to the cantilever resonance. These unwanted peaks are caused by acoustic modes of the liquid and the setup arising from the indirect oscillation excitation by a piezoelectric transducer. Photothermal excitation has been identified as a suitable method for exciting the cantilever in a direct manner. Here, we present a simple design for implementing photothermal excitation in a modified Multimode scan head from Bruker. Our approach is based on adding a few components only to keep the modifications as simple as possible and to maintain the low noise level of the original setup with a typical deflection noise density of about 15 fm/√(Hz) measured in aqueous solution. The success of the modification is illustrated by a comparison of the resonance spectra obtained with piezoelectric and photothermal excitation. The performance of the systems is demonstrated by presenting high-resolution images on bare calcite in liquid as well as organic adsorbates (Alizarin Red S) on calcite with simultaneous atomic resolution of the underlying calcite substrate.

  17. In-trap fluorescence detection of atoms in a microscopic dipole trap

    CERN Document Server

    Hilliard, A J; Sompet, P; Carpentier, A V; Andersen, M F

    2015-01-01

    We investigate fluorescence detection using a standing wave of blue-detuned light of one or more atoms held in a deep, microscopic dipole trap. The blue-detuned standing wave realizes a Sisyphus laser cooling mechanism so that an atom can scatter many photons while remaining trapped. When imaging more than one atom, the blue detuning limits loss due to inelastic light-assisted collisions. Using this standing wave probe beam, we demonstrate that we can count from one to the order of 100 atoms in the microtrap with sub-poissonian precision.

  18. Invited Article: Autonomous assembly of atomically perfect nanostructures using a scanning tunneling microscope

    Energy Technology Data Exchange (ETDEWEB)

    Celotta, Robert J., E-mail: robert.celotta@nist.gov, E-mail: joseph.stroscio@nist.gov; Hess, Frank M.; Rutter, Gregory M.; Stroscio, Joseph A., E-mail: robert.celotta@nist.gov, E-mail: joseph.stroscio@nist.gov [Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States); Balakirsky, Stephen B. [Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States); Georgia Tech Research Institute, Atlanta, Georgia 30332 (United States); Fein, Aaron P. [Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States)

    2014-12-15

    A major goal of nanotechnology is to develop the capability to arrange matter at will by placing individual atoms at desired locations in a predetermined configuration to build a nanostructure with specific properties or function. The scanning tunneling microscope has demonstrated the ability to arrange the basic building blocks of matter, single atoms, in two-dimensional configurations. An array of various nanostructures has been assembled, which display the quantum mechanics of quantum confined geometries. The level of human interaction needed to physically locate the atom and bring it to the desired location limits this atom assembly technology. Here we report the use of autonomous atom assembly via path planning technology; this allows atomically perfect nanostructures to be assembled without the need for human intervention, resulting in precise constructions in shorter times. We demonstrate autonomous assembly by assembling various quantum confinement geometries using atoms and molecules and describe the benefits of this approach.

  19. Invited Article: Autonomous assembly of atomically perfect nanostructures using a scanning tunneling microscope.

    Science.gov (United States)

    Celotta, Robert J; Balakirsky, Stephen B; Fein, Aaron P; Hess, Frank M; Rutter, Gregory M; Stroscio, Joseph A

    2014-12-01

    A major goal of nanotechnology is to develop the capability to arrange matter at will by placing individual atoms at desired locations in a predetermined configuration to build a nanostructure with specific properties or function. The scanning tunneling microscope has demonstrated the ability to arrange the basic building blocks of matter, single atoms, in two-dimensional configurations. An array of various nanostructures has been assembled, which display the quantum mechanics of quantum confined geometries. The level of human interaction needed to physically locate the atom and bring it to the desired location limits this atom assembly technology. Here we report the use of autonomous atom assembly via path planning technology; this allows atomically perfect nanostructures to be assembled without the need for human intervention, resulting in precise constructions in shorter times. We demonstrate autonomous assembly by assembling various quantum confinement geometries using atoms and molecules and describe the benefits of this approach.

  20. Massively Parallel Atomic Force Microscope with Digital Holographic Readout

    Energy Technology Data Exchange (ETDEWEB)

    Sache, L [Laboratory of Robotic Systems, Ecole Polytechnique Federale de Lausanne, EPFLSRO1, Station 9, CH-1015 Lausanne (Switzerland); Kawakatsu, H [Institute of Industrial Science, University of Tokyo, Tokyo (Japan); Emery, Y [Lyncee Tec SA, PSE-A, CH-1015 Lausanne (Switzerland); Bleuler, H [Laboratory of Robotic Systems, Ecole Polytechnique Federale de Lausanne, EPFLSRO1, Station 9, CH-1015 Lausanne (Switzerland)

    2007-03-15

    Massively Parallel Scanning Probe Microscopy is an obvious path for data storage (E Grochowski, R F Hoyt, Future Trends in Hard disc Drives, IEEE Trans. Magn. 1996, 32, 1850- 1854; J L Griffin, S W Schlosser, G R Ganger and D F Nagle, Modeling and Performance of MEMS-Based Storage Devices, Proc. ACM SIGMETRICS, 2000). Current experimental systems still lay far behind Hard Disc Drive (HDD) or Digital Video Disk (DVD), be it in access speed, data throughput, storage density or cost per bit. This paper presents an entirely new approach with the promise to break several of these barriers. The key idea is readout of a Scanning Probes Microscope (SPM) array by Digital Holographic Microscopy (DHM). This technology directly gives phase information at each pixel of a CCD array. This means that no contact line to each individual SPM probes is needed. The data is directly available in parallel form. Moreover, the optical setup needs in principle no expensive components, optical (or, to a large extent, mechanical) imperfections being compensated in the signal processing, i.e. in electronics. This gives the system the potential for a low cost device with fast Terabit readout capability.

  1. Development of Atomic Force Microscope for Arthroscopic Knee Cartilage Inspection

    Science.gov (United States)

    Imer, Raphaël; Akiyama, Terunobu; de Rooij, Nicolaas F.; Stolz, Martin; Aebi, Ueli; Friederich, Niklaus F.; Koenig, Uwe; Wirz, Dieter; Daniels, A. U.; Staufer, Urs

    2006-03-01

    A recent study, based on ex vivo unconfined compression testing of normal, diseased, and enzymatically altered cartilage, revealed that a scanning force microscope (SFM), used as a nano-intender, is sensitive enough to enable measurement of alterations in the biomechanical properties of cartilage. Based on these ex vivo measurements, we have designed a quantitative diagnosis tool, the scanning force arthroscope (SFA), able to perform in vivo measurements during a standard arthroscopic procedure. For stabilizing and positioning the instrument relative to the surface under investigation, a pneumatic system has been developed. A segmented piezoelectric tube was used to perform the indentation displacement, and a pyramidal nanometer-scale silicon tip mounted on a cantilever with an integrated deflection sensor measured the biomechanical properties of cartilage. Mechanical means were designed to protect the fragile cantilever during the insertion of the instrument into the knee joint. The stability of the pneumatic stage was checked with a prototype SFA. In a series of tests, load-displacement curves were recorded in a knee phantom and, more recently, in a pig’s leg.

  2. High-Throughput Atomic Force Microscopes Operating in Parallel

    CERN Document Server

    Sadeghian, H; Dekker, B; Winters, J; Bijnagte, T; Rijnbeek, R

    2016-01-01

    Atomic force microscopy (AFM) is an essential nanoinstrument technique for several applications such as cell biology and nanoelectronics metrology and inspection. The need for statistically significant sample sizes means that data collection can be an extremely lengthy process in AFM. The use of a single AFM instrument is known for its very low speed and not being suitable for scanning large areas, resulting in very-low-throughput measurement. We address this challenge by parallelizing AFM instruments. The parallelization is achieved by miniaturizing the AFM instrument and operating many of them simultaneously. This nanoinstrument has the advantages that each miniaturized AFM can be operated independently and that the advances in the field of AFM, both in terms of speed and imaging modalities, can be implemented more easily. Moreover, a parallel AFM instrument also allows one to measure several physical parameters simultaneously; while one instrument measures nano-scale topography, another instrument can meas...

  3. Atomic force microscopic observation of surface-supported human erythrocytes

    Science.gov (United States)

    Ho, Mon-Shu; Kuo, Feng-Jia; Lee, Yu-Siang; Cheng, Chao-Min

    2007-07-01

    The nanomechanical characteristics of the membrane cytoskeleton of human erythrocytes were studied using atomic force microscopy (AFM). The self-assembly, fine structure, cell diameter, thickness, and reticulate cytoskeleton of erythrocytes on the mica surface were investigated. The adhesive forces that correspond to the membrane elasticity of various parts of the erythrocyte membrane surface were measured directly by AFM to be 0.64±0.14nN for cell indentation, 4.2±0.7nN for cell hump, and 11.5nN for side waist, respectively. The deformation of erythrocytes was discussed. Standing waves on the membrane that were set up by increased AFM amplitude were observed. The propagating velocity on the erythrocyte membrane was estimated to be ˜2.02×10-2m/s. Liquid physiological conditions were considered throughout.

  4. A quantum gas microscope for detecting single atoms in a Hubbard-regime optical lattice.

    Science.gov (United States)

    Bakr, Waseem S; Gillen, Jonathon I; Peng, Amy; Fölling, Simon; Greiner, Markus

    2009-11-05

    Recent years have seen tremendous progress in creating complex atomic many-body quantum systems. One approach is to use macroscopic, effectively thermodynamic ensembles of ultracold atoms to create quantum gases and strongly correlated states of matter, and to analyse the bulk properties of the ensemble. For example, bosonic and fermionic atoms in a Hubbard-regime optical lattice can be used for quantum simulations of solid-state models. The opposite approach is to build up microscopic quantum systems atom-by-atom, with complete control over all degrees of freedom. The atoms or ions act as qubits and allow the realization of quantum gates, with the goal of creating highly controllable quantum information systems. Until now, the macroscopic and microscopic strategies have been fairly disconnected. Here we present a quantum gas 'microscope' that bridges the two approaches, realizing a system in which atoms of a macroscopic ensemble are detected individually and a complete set of degrees of freedom for each of them is determined through preparation and measurement. By implementing a high-resolution optical imaging system, single atoms are detected with near-unity fidelity on individual sites of a Hubbard-regime optical lattice. The lattice itself is generated by projecting a holographic mask through the imaging system. It has an arbitrary geometry, chosen to support both strong tunnel coupling between lattice sites and strong on-site confinement. Our approach can be used to directly detect strongly correlated states of matter; in the context of condensed matter simulation, this corresponds to the detection of individual electrons in the simulated crystal. Also, the quantum gas microscope may enable addressing and read-out of large-scale quantum information systems based on ultracold atoms.

  5. Characterization of Akiyama probe applied to dual-probes atomic force microscope

    Science.gov (United States)

    Wang, Hequn; Gao, Sitian; Li, Wei; Shi, Yushu; Li, Qi; Li, Shi; Zhu, Zhendong

    2016-10-01

    The measurement of nano-scale line-width has always been important and difficult in the field of nanometer measurements, while the rapid development of integrated circuit greatly raises the demand again. As one kind of scanning probe microscope (SPM), atomic force microscope (AFM) can realize quasi three-dimensional measurement, which is widely used in nanometer scale line-width measurement. Our team researched a dual-probes atomic force microscope, which can eliminate the prevalent effect of probe width on measurement results. In dual-probes AFM system, a novel head are newly designed. A kind of self-sensing and self-exciting probes which is Nanosensors cooperation's patented probe—Akiyama probe, is used in this novel head. The Akiyama probe applied to dual-probe atomic force microscope is one of the most important issues. The characterization of Akiyama probe would affect performance and accuracy of the whole system. The fundamental features of the Akiyama probe are electrically and optically characterized in "approach-withdraw" experiments. Further investigations include the frequency response of an Akiyama probe to small mechanical vibrations externally applied to the tip and the effective loading force yielding between the tip and the sample during the periodic contact. We hope that the characterization of the Akiyama probe described in this paper will guide application for dual-probe atomic force microscope.

  6. Combined laser and atomic force microscope lithography on aluminum: Mask fabrication for nanoelectromechanical systems

    DEFF Research Database (Denmark)

    Berini, Abadal Gabriel; Boisen, Anja; Davis, Zachary James;

    1999-01-01

    A direct-write laser system and an atomic force microscope (AFM) are combined to modify thin layers of aluminum on an oxidized silicon substrate, in order to fabricate conducting and robust etch masks with submicron features. These masks are very well suited for the production of nanoelectromecha......A direct-write laser system and an atomic force microscope (AFM) are combined to modify thin layers of aluminum on an oxidized silicon substrate, in order to fabricate conducting and robust etch masks with submicron features. These masks are very well suited for the production...

  7. High-throughput atomic force microscopes operating in parallel

    Science.gov (United States)

    Sadeghian, Hamed; Herfst, Rodolf; Dekker, Bert; Winters, Jasper; Bijnagte, Tom; Rijnbeek, Ramon

    2017-03-01

    Atomic force microscopy (AFM) is an essential nanoinstrument technique for several applications such as cell biology and nanoelectronics metrology and inspection. The need for statistically significant sample sizes means that data collection can be an extremely lengthy process in AFM. The use of a single AFM instrument is known for its very low speed and not being suitable for scanning large areas, resulting in a very-low-throughput measurement. We address this challenge by parallelizing AFM instruments. The parallelization is achieved by miniaturizing the AFM instrument and operating many of them simultaneously. This instrument has the advantages that each miniaturized AFM can be operated independently and that the advances in the field of AFM, both in terms of speed and imaging modalities, can be implemented more easily. Moreover, a parallel AFM instrument also allows one to measure several physical parameters simultaneously; while one instrument measures nano-scale topography, another instrument can measure mechanical, electrical, or thermal properties, making it a lab-on-an-instrument. In this paper, a proof of principle of such a parallel AFM instrument has been demonstrated by analyzing the topography of large samples such as semiconductor wafers. This nanoinstrument provides new research opportunities in the nanometrology of wafers and nanolithography masks by enabling real die-to-die and wafer-level measurements and in cell biology by measuring the nano-scale properties of a large number of cells.

  8. Reconstructing the distributed force on an atomic force microscope cantilever

    Science.gov (United States)

    Wagner, Ryan; Killgore, Jason

    2017-03-01

    A methodology is developed to reconstruct the force applied to an atomic force microscopy (AFM) cantilever given the shape in which it vibrates. This is accomplished by rewriting Bernoulli–Euler beam theory such that the force on the cantilever is approximated as a linear superposition of the theoretical cantilever eigenmodes. The weighting factors in this summation are calculated from the amplitude and phase measured along the length of the cantilever. The accuracy of the force reconstruction is shown to depend on the frequency at which the measurement is performed, the number of discrete points measured along the length of the cantilever, and the signal-to-noise ratio of the measured signal. In contrast to other AFM force reconstruction techniques, this method can reconstruct the distribution of force applied over the length of the AFM cantilever. However, this method performs poorly for localized forces applied to the cantilever, such as is typical of most tip–sample interaction forces. Proof of concept experiments are performed on an electrostatically excited cantilever and the expected force distribution is recovered. This force reconstruction technique offers previously unavailable insight into the distributed forces experienced by an AFM cantilever.

  9. Surface features on Sahara soil dust particles made visible by atomic force microscope (AFM) phase images

    OpenAIRE

    Andreae, M. O.; G. Helas

    2008-01-01

    We show that atomic force microscopy (AFM) phase images can reveal surface features of soil dust particles, which are not evident using other microscopic methods. The non-contact AFM method is able to resolve topographical structures in the nanometer range as well as to uncover repulsive atomic forces and attractive van der Waals' forces, and thus gives insight to surface properties. Though the method does not allow quantitative assignment in terms of chemical compound description, it clearly...

  10. Atomic force microscopic imaging of Acanthamoeba castellanii and Balamuthia mandrillaris trophozoites and cysts.

    Science.gov (United States)

    Aqeel, Yousuf; Siddiqui, Ruqaiyyah; Ateeq, Muhammad; Raza Shah, Muhammad; Kulsoom, Huma; Khan, Naveed Ahmed

    2015-01-01

    Light microscopy and electron microscopy have been successfully used in the study of microbes, as well as free-living protists. Unlike light microscopy, which enables us to observe living organisms or the electron microscope which provides a two-dimensional image, atomic force microscopy provides a three-dimensional surface profile. Here, we observed two free-living amoebae, Acanthamoeba castellanii and Balamuthia mandrillaris under the phase contrast inverted microscope, transmission electron microscope and atomic force microscope. Although light microscopy was of lower magnification, it revealed functional biology of live amoebae such as motility and osmoregulation using contractile vacuoles of the trophozoite stage, but it is of limited value in defining the cyst stage. In contrast, transmission electron microscopy showed significantly greater magnification and resolution to reveal the ultra-structural features of trophozoites and cysts including intracellular organelles and cyst wall characteristics but it only produced a snapshot in time of a dead amoeba cell. Atomic force microscopy produced three-dimensional images providing detailed topographic description of shape and surface, phase imaging measuring boundary stiffness, and amplitude measurements including width, height and length of A. castellanii and B. mandrillaris trophozoites and cysts. These results demonstrate the importance of the application of various microscopic methods in the biological and structural characterization of the whole cell, ultra-structural features, as well as surface components and cytoskeleton of protist pathogens.

  11. Relaxation of a simulated lipid bilayer vesicle compressed by an atomic force microscope

    Science.gov (United States)

    Barlow, Ben M.; Bertrand, Martine; Joós, Béla

    2016-11-01

    Using coarse-grained molecular dynamics simulations, we study the relaxation of bilayer vesicles, uniaxially compressed by an atomic force microscope cantilever. The relaxation time exhibits a strong force dependence. Force-compression curves are very similar to recent experiments wherein giant unilamellar vesicles were compressed in a nearly identical manner.

  12. Atomic force microscope with combined FTIR-Raman spectroscopy having a micro thermal analyzer

    Science.gov (United States)

    Fink, Samuel D [Aiken, SC; Fondeur, Fernando F [North Augusta, SC

    2011-10-18

    An atomic force microscope is provided that includes a micro thermal analyzer with a tip. The micro thermal analyzer is configured for obtaining topographical data from a sample. A raman spectrometer is included and is configured for use in obtaining chemical data from the sample.

  13. Nano Goes to School: A Teaching Model of the Atomic Force Microscope

    Science.gov (United States)

    Planinsic, Gorazd; Kovac, Janez

    2008-01-01

    The paper describes a teaching model of the atomic force microscope (AFM), which proved to be successful in the role of an introduction to nanoscience in high school. The model can demonstrate the two modes of operation of the AFM (contact mode and oscillating mode) as well as some basic principles that limit the resolution of the method. It can…

  14. A Computer-Controlled Classroom Model of an Atomic Force Microscope

    Science.gov (United States)

    Engstrom, Tyler A.; Johnson, Matthew M.; Eklund, Peter C.; Russin, Timothy J.

    2015-01-01

    The concept of "seeing by feeling" as a way to circumvent limitations on sight is universal on the macroscopic scale--reading Braille, feeling one's way around a dark room, etc. The development of the atomic force microscope (AFM) in 1986 extended this concept to imaging in the nanoscale. While there are classroom demonstrations that use…

  15. A Computer-Controlled Classroom Model of an Atomic Force Microscope

    Science.gov (United States)

    Engstrom, Tyler A.; Johnson, Matthew M.; Eklund, Peter C.; Russin, Timothy J.

    2015-01-01

    The concept of "seeing by feeling" as a way to circumvent limitations on sight is universal on the macroscopic scale--reading Braille, feeling one's way around a dark room, etc. The development of the atomic force microscope (AFM) in 1986 extended this concept to imaging in the nanoscale. While there are classroom demonstrations that use…

  16. Surface topography characterization using an atomic force microscope mounted on a coordinate measuring machine

    DEFF Research Database (Denmark)

    De Chiffre, Leonardo; Hansen, H.N; Kofod, N

    1999-01-01

    The paper describes the construction, testing and use of an integrated system for topographic characterization of fine surfaces on parts having relatively big dimensions. An atomic force microscope (AFM) was mounted on a manual three-coordinate measuring machine (CMM) achieving free positioning...

  17. Microscopic Many-Body Theory of Atomic Bose Gases near a Feshbach Resonance

    NARCIS (Netherlands)

    Duine, R.A.; Stoof, H.T.C.

    2003-01-01

    A Feshbach resonance in the s-wave scattering length occurs if the energy of the two atoms in the incoming open channel is close to the energy of a bound state in a coupled closed channel. Starting from the microscopic Hamiltonian that describes this situation, we derive the effective atom–molecule

  18. Nano Goes to School: A Teaching Model of the Atomic Force Microscope

    Science.gov (United States)

    Planinsic, Gorazd; Kovac, Janez

    2008-01-01

    The paper describes a teaching model of the atomic force microscope (AFM), which proved to be successful in the role of an introduction to nanoscience in high school. The model can demonstrate the two modes of operation of the AFM (contact mode and oscillating mode) as well as some basic principles that limit the resolution of the method. It can…

  19. Spontaneous decay of an atom excited in a dense and disordered atomic ensemble: quantum microscopic approach

    CERN Document Server

    Kuraptsev, A S

    2016-01-01

    On the basis of general theoretical results developed previously in [I. M. Sokolov et al., J. Exp. Theor. Phys. 112, 246 (2011)], we analyze spontaneous decay of a single atom inside cold atomic clouds under conditions when the averaged interatomic separation is less or comparable with the wavelength of quasi resonant radiation. Beyond the decay dynamics we analyze shifts of resonance as well as distortion of the spectral shape of the atomic transition.

  20. Efficient loading of a single neutral atom into an optical microscopic tweezer

    Institute of Scientific and Technical Information of China (English)

    何军; 刘贝; 刁文婷; 王杰英; 靳刚; 王军民

    2015-01-01

    A single atom in a magneto–optical trap (MOT) with trap size (hundreds of micrometers) can be transferred into an optical microscopic tweezer with a probability of∼100%. The ability to transfer a single atom into two traps back and forth allows us to study the loading process. The loading probability is found to be insensitive to the geometric overlap of the MOT and the tweezer. It is therefore possible to perform simultaneously loading of a single atom into all sites of the tweezer array for many qubits. In particular, we present a simulation of the one-dimensional and two-dimensional arrays of an optical microscopic tweezer. We find the same qualitative behavior for all of the trap parameters.

  1. Efficient loading of a single neutral atom into an optical microscopic tweezer

    Science.gov (United States)

    He, Jun; Liu, Bei; Diao, Wen-Ting; Wang, Jie-Ying; Jin, Gang; Wang, Jun-Min

    2015-04-01

    A single atom in a magneto-optical trap (MOT) with trap size (hundreds of micrometers) can be transferred into an optical microscopic tweezer with a probability of ~ 100%. The ability to transfer a single atom into two traps back and forth allows us to study the loading process. The loading probability is found to be insensitive to the geometric overlap of the MOT and the tweezer. It is therefore possible to perform simultaneously loading of a single atom into all sites of the tweezer array for many qubits. In particular, we present a simulation of the one-dimensional and two-dimensional arrays of an optical microscopic tweezer. We find the same qualitative behavior for all of the trap parameters. Project supported by the National Major Scientific Research Program of China (Grant No. 2012CB921601) and the National Natural Science Foundation of China (Grant Nos. 61205215, 11274213, and 61475091).

  2. Efficient elastic imaging of single atoms on ultrathin supports in a scanning transmission electron microscope.

    Science.gov (United States)

    Hovden, Robert; Muller, David A

    2012-12-01

    Mono-atomic-layer membranes such as graphene offer new opportunities for imaging and detecting individual light atoms in transmission electron microscopes (TEM). For such applications where multiple scattering and diffraction effects are weak, we evaluate the detection efficiency and interpretability of single atom images for the most common detector geometries using quantitative quantum mechanical simulations. For well-resolved and atomically-thin specimens, the low angle annular dark field (LAADF) detector can provide a significant increase in signal-to-noise over other common detector geometries including annular bright field and incoherent bright field. This dramatically improves the visibility of organic specimens on atomic-layer membranes. Simulations of Adenosine Triphosphate (ATP) imaged under ideal conditions indicate the minimal dose requirements for elastic imaging by STEM or conventional TEM still exceed previously reported dose limits. Copyright © 2012 Elsevier B.V. All rights reserved.

  3. Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy

    Energy Technology Data Exchange (ETDEWEB)

    Schwarz, Udo; Albers, Boris J.; Liebmann, Marcus; Schwendemann, Todd C.; Baykara, Mehmet Z.; Heyde, Markus; Salmeron, Miquel; Altman, Eric I.; Schwarz, Udo D.

    2008-02-27

    The authors present the design and first results of a low-temperature, ultrahigh vacuum scanning probe microscope enabling atomic resolution imaging in both scanning tunneling microscopy (STM) and noncontact atomic force microscopy (NC-AFM) modes. A tuning-fork-based sensor provides flexibility in selecting probe tip materials, which can be either metallic or nonmetallic. When choosing a conducting tip and sample, simultaneous STM/NC-AFM data acquisition is possible. Noticeable characteristics that distinguish this setup from similar systems providing simultaneous STM/NC-AFM capabilities are its combination of relative compactness (on-top bath cryostat needs no pit), in situ exchange of tip and sample at low temperatures, short turnaround times, modest helium consumption, and unrestricted access from dedicated flanges. The latter permits not only the optical surveillance of the tip during approach but also the direct deposition of molecules or atoms on either tip or sample while they remain cold. Atomic corrugations as low as 1 pm could successfully be resolved. In addition, lateral drifts rates of below 15 pm/h allow long-term data acquisition series and the recording of site-specific spectroscopy maps. Results obtained on Cu(111) and graphite illustrate the microscope's performance.

  4. Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy

    Science.gov (United States)

    Albers, Boris J.; Liebmann, Marcus; Schwendemann, Todd C.; Baykara, Mehmet Z.; Heyde, Markus; Salmeron, Miquel; Altman, Eric I.; Schwarz, Udo D.

    2008-03-01

    We present the design and first results of a low-temperature, ultrahigh vacuum scanning probe microscope enabling atomic resolution imaging in both scanning tunneling microscopy (STM) and noncontact atomic force microscopy (NC-AFM) modes. A tuning-fork-based sensor provides flexibility in selecting probe tip materials, which can be either metallic or nonmetallic. When choosing a conducting tip and sample, simultaneous STM/NC-AFM data acquisition is possible. Noticeable characteristics that distinguish this setup from similar systems providing simultaneous STM/NC-AFM capabilities are its combination of relative compactness (on-top bath cryostat needs no pit), in situ exchange of tip and sample at low temperatures, short turnaround times, modest helium consumption, and unrestricted access from dedicated flanges. The latter permits not only the optical surveillance of the tip during approach but also the direct deposition of molecules or atoms on either tip or sample while they remain cold. Atomic corrugations as low as 1pm could successfully be resolved. In addition, lateral drifts rates of below 15pm/h allow long-term data acquisition series and the recording of site-specific spectroscopy maps. Results obtained on Cu(111) and graphite illustrate the microscope's performance.

  5. A Study on HA Titanium Surface with Atomic Force Microscope (AFM)

    Institute of Scientific and Technical Information of China (English)

    2005-01-01

    Three kinds of titanium surface especially the HA surface are analyzed. Titanium was treated by 3 kinds of methods that were acid & alkali, calcic solution and apatite solution. Samples were observed by optic microscope and atomic force microscope ( AFM). The typical surface morphology of the acid and alkali group is little holes, and on the two HA surface the tiny protuberances is typical. The surface treated by apatite solution was smoother than the two formers. The rough surface treated with acid and alkali was propitious to Ca + , Pand proteins' adhesion, and the relatively smooth HA surface was of benefit to the cell adhesion.

  6. Surface features on Sahara soil dust particles made visible by atomic force microscope (AFM) phase images

    Science.gov (United States)

    Helas, G.; Andreae, M. O.

    2008-10-01

    We show that atomic force microscopy (AFM) phase images can reveal surface features of soil dust particles, which are not evident using other microscopic methods. The non-contact AFM method is able to resolve topographical structures in the nanometer range as well as to uncover repulsive atomic forces and attractive van der Waals' forces, and thus gives insight to surface properties. Though the method does not allow quantitative assignment in terms of chemical compound description, it clearly shows deposits of distinguishable material on the surface. We apply this technique to dust aerosol particles from the Sahara collected over the Atlantic Ocean and describe micro-features on the surfaces of such particles.

  7. Adhesion Force Measurements Using an Atomic Force Microscope Upgraded with a Linear Position Sensitive Detector

    Science.gov (United States)

    Pierce, M.; Stuart, J.; Pungor, A.; Dryden, P.

    2012-01-01

    The atomic force microscope (AFM), in addition to providing images on an atomic scale, can be used to measure the forces between surfaces and the AFM probe. The potential uses of mapping the adhesive forces on the surface include a spatial determination of surface energy and a direct identification of surface proteins through specific protein–ligand binding interactions. The capabilities of the AFM to measure adhesive forces can be extended by replacing the four-quadrant photodiode detection sensor with an external linear position sensitive detector and by utilizing a dedicated user-programmable signal generator and acquisiton system. Such an upgrade enables the microscope to measure in the larger dynamic range of adhesion forces, improves the sensitivity and linearity of the measurement, and eliminates the problems inherent to the multiple repetitious contacts between the AFM probe and the specimen surface. PMID:25125792

  8. Dielectrophoretic positioning of single nanoparticles on atomic force microscope tips for tip-enhanced Raman spectroscopy.

    Science.gov (United States)

    Leiterer, Christian; Deckert-Gaudig, Tanja; Singh, Prabha; Wirth, Janina; Deckert, Volker; Fritzsche, Wolfgang

    2015-05-01

    Tip-enhanced Raman spectroscopy, a combination of Raman spectroscopy and scanning probe microscopy, is a powerful technique to detect the vibrational fingerprint of molecules at the nanometer scale. A metal nanoparticle at the apex of an atomic force microscope tip leads to a large enhancement of the electromagnetic field when illuminated with an appropriate wavelength, resulting in an increased Raman signal. A controlled positioning of individual nanoparticles at the tip would improve the reproducibility of the probes and is quite demanding due to usually serial and labor-intensive approaches. In contrast to commonly used submicron manipulation techniques, dielectrophoresis allows a parallel and scalable production, and provides a novel approach toward reproducible and at the same time affordable tip-enhanced Raman spectroscopy tips. We demonstrate the successful positioning of an individual plasmonic nanoparticle on a commercial atomic force microscope tip by dielectrophoresis followed by experimental proof of the Raman signal enhancing capabilities of such tips.

  9. Surface Electromechanical Coupling on DLC Film with Conductive Atomic Force Microscope

    Institute of Scientific and Technical Information of China (English)

    朱守星; 丁建宁; 范真; 李长生; 蔡兰; 杨继昌

    2004-01-01

    Diamond-like carbon (DLC) film composed of microscopically insulation but microscopically a mixture of conducting (sp2) and insulating (spa) phases was discussed on the local modification with a conductive atomic force microscope (C-AFM). Especially, a topographic change was observed when a direct current (DC) bias-voltage was applied to the DLC film. Experimental results show that a nanoscale pit on DLC surface was formed when applying a positive 25 V on DLC film. According to the interacting force between CoCr-coated microelectronic scanning probe (MESP) tip and DLC surface, as well as the Sondheimer oscillation theory, the "scalewing effect" of the pit was explained. Electromechanical coupling on DLC film suggested that the depth of pits increased with an increase of load applied to surface when the cantilever-deflected signal was less than a certain threshold voltage.

  10. Visualization of Cellulose Microfibrils of Phyllostachys pubescens Fibers with Atomic Force Microscope

    Institute of Scientific and Technical Information of China (English)

    2008-01-01

    Atomic force microscope(AFM) was used to investigate the arrangement of cellulose microfibrils (CMF) in Moso bamboo (Phyllostachys pubescens) fibers. Two methods of sample preparation were used here for different purposes. The first method was chemical maceration with a mixture of hydrogen peroxide and glacial acetic acid, through which the obtained fibers were suitable for observing the orientation of CMF in the primary wal1. The other method was to prepare tangential microtomed sections with a thickness o...

  11. Effect of hydration film on scanning images of atomic force microscope

    Institute of Scientific and Technical Information of China (English)

    2006-01-01

    A standard calibration grating was used for image scanning to investigate the effect of hydration films on imaging resolution by Atomic Force Microscope (AFM). The results showed that the hydration films greatly affect the imaging resolution for the tapping mode, but no evident effect on the contact mode. The possible reasons for the effect of hydration films on scanning images of AFM are also brought forward here.

  12. Nanostethoscopy: A new mode of operation of the atomic force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Keaton, A.; Holzrichter, J.F.; Balhorn, R.; Siekaus, W.J.

    1994-02-01

    The authors introduce a new mode of operation of the atomic force microscope (AFM). This detection scheme, a {open_quotes}Nano-Stethoscope{close_quotes}. Involves using the atomic force microscope in a novel acoustic mode not generally recognized. The Nano-Stethoscope uses the conventional scanning feature to locate a desired site, positions the AFM microscope tip over the site, holds the cantilever stationary (in x and v) and records the tip`s z-motion as a function of time. The tip/cantilever system thus functions as a micro-motion detector to respond to characteristic {open_quotes}pulsations{close_quotes}, nano-configurational chances, or any other event that influences the position of the tip as a function of time. The authors have demonstrated the feasibility of using the tip of an AFM in this manner in a biological system with a measurement of the vibrations of an emerging shrimp egg nauplius ({approximately}3 {mu}m. -10 Hz) and on the Angstrom scale in a non-biological system i.e.. the thermal expansion of metal interconnect lines on a microelectronic circuit.

  13. Cellular level nanomanipulation using atomic force microscope aided with superresolution imaging

    Science.gov (United States)

    Chacko, Jenu Varghese; Harke, Benjamin; Canale, Claudio; Diaspro, Alberto

    2014-10-01

    Atomic force microscopes (AFM) provide topographical and mechanical information of the sample with very good axial resolution, but are limited in terms of chemical specificity and operation time-scale. An optical microscope coupled to an AFM can recognize and target an area of interest using specific identification markers like fluorescence tags. A high resolution fluorescence microscope can visualize fluorescence structures or molecules below the classical optical diffraction limit and reach nanometer scale resolution. A stimulated emission depletion (STED) microscopy superresolution (SR) microscope coupled to an AFM is an example in which the AFM tip gains nanoscale manipulation capabilities. The SR targeting and visualization ability help in fast and specific identification of subdiffraction-sized cellular structures and manoeuvring the AFM tip onto the target. We demonstrate how to build a STED AFM and use it for biological nanomanipulation aided with fast visualization. The STED AFM based bionanomanipulation is presented for the first time in this article. This study points to future nanosurgeries performable at single-cell level and a physical targeted manipulation of cellular features as it is currently used in research domains like nanomedicine and nanorobotics.

  14. The NanoBeamBalance: A passive, tensile-test device for the atomic force microscope

    Science.gov (United States)

    Wenger, M. P. E.; Mesquida, P.

    2011-05-01

    An add-on device is presented, which significantly expands the force measurement capabilities of the atomic force microscope (AFM). The device consists of a completely passive mechanism, which translates the vertical motion of the AFM tip in force measurements into a horizontal motion of two sample support pads. The advantage is that it is much easier to deposit microscopic samples from suspension onto flat surfaces than to attach them reliably between tip and a surface. The working-principle and the design of the device is comprehensively described and demonstrated on the example of collagen fibres with a diameter of a few μm. Well-defined tensile measurements in longitudinal direction were performed, showing that the tensile stiffness of collagen fibres from rat tail tendon decreases by a factor of 5 when rehydrated from a dried sample and slowly increases upon cross-linking with glutaraldehyde.

  15. Development of nanomanipulator using a high-speed atomic force microscope coupled with a haptic device

    Energy Technology Data Exchange (ETDEWEB)

    Iwata, F., E-mail: tmfiwat@ipc.shizuoka.ac.jp [Faculty of Engineering, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8561 (Japan); Research Institute of Electronics, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8011 (Japan); Ohashi, Y.; Ishisaki, I. [Faculty of Engineering, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8561 (Japan); Picco, L.M. [H Will Physics Laboratory and IRC in Nanotechnology, University of Bristol, Tyndall Avenue, Bristol BS8 1TL (United Kingdom); Ushiki, T. [Graduate School of Medical and Dental Sciences, Niigata University, Asahimachidori, Niigata, 951-8122 (Japan)

    2013-10-15

    The atomic force microscope (AFM) has been widely used for surface fabrication and manipulation. However, nanomanipulation using a conventional AFM is inefficient because of the sequential nature of the scan-manipulation scan cycle, which makes it difficult for the operator to observe the region of interest and perform the manipulation simultaneously. In this paper, a nanomanipulation technique using a high-speed atomic force microscope (HS-AFM) is described. During manipulation using the AFM probe, the operation is periodically interrupted for a fraction of a second for high-speed imaging that allows the topographical image of the manipulated surface to be periodically updated. With the use of high-speed imaging, the interrupting time for imaging can be greatly reduced, and as a result, the operator almost does not notice the blink time of the interruption for imaging during the manipulation. This creates a more intuitive interface with greater feedback and finesse to the operator. Nanofabrication under real-time monitoring was performed to demonstrate the utility of this arrangement for real-time nanomanipulation of sample surfaces under ambient conditions. Furthermore, the HS-AFM is coupled with a haptic device for the human interface, enabling the operator to move the HS-AFM probe to any position on the surface while feeling the response from the surface during the manipulation. - Highlights: • A nanomanipulater based on a high-speed atomic force microscope was developped. • High-speed imaging provides a valuable feedback during the manipulation operation. • Operator can feel the response from the surface via a haptic device during manipulation. • Nanofabrications under real-time monitoring were successfully performed.

  16. Probing molecular interaction between transferrin and anti-transferrin by atomic force microscope

    Institute of Scientific and Technical Information of China (English)

    2006-01-01

    The interaction between transferrin (Tf) and its antibody was investigated by atomic force microscope. Tf-antibody was immobilized on the Au-coated glass slide, and the specific combination between antibody and antigen was also characterized by AFM. The results showed that holo-transferrin was jogged with anti-transferrin, and binded anti-tran- sferrin more tightly than apo-transferrin. The force- distance curves revealed that the affinity of anti-trans- ferrin and holo-transferrin was much stronger than that of apo-transferrin.

  17. Strong electromechanical coupling of an atomic force microscope cantilever to a quantum dot.

    Science.gov (United States)

    Bennett, Steven D; Cockins, Lynda; Miyahara, Yoichi; Grütter, Peter; Clerk, Aashish A

    2010-01-08

    We present theoretical and experimental results on the mechanical damping of an atomic force microscope cantilever strongly coupled to a self-assembled InAs quantum dot. When the cantilever oscillation amplitude is large, its motion dominates the charge dynamics of the dot which in turn leads to nonlinear, amplitude-dependent damping of the cantilever. We observe highly asymmetric line shapes of Coulomb blockade peaks in the damping that reflect the degeneracy of energy levels on the dot. Furthermore, we predict that excited state spectroscopy is possible by studying the damping versus oscillation amplitude, in analogy with varying the amplitude of an ac gate voltage.

  18. Reliable measurement of elastic modulus of cells by nanoindentation in an atomic force microscope

    KAUST Repository

    Zhou, Zhoulong

    2012-04-01

    The elastic modulus of an oral cancer cell line UM1 is investigated by nanoindentation in an atomic force microscope with a flat-ended tip. The commonly used Hertzian method gives apparent elastic modulus which increases with the loading rate, indicating strong effects of viscoelasticity. On the contrary, a rate-jump method developed for viscoelastic materials gives elastic modulus values which are independent of the rate-jump magnitude. The results show that the rate-jump method can be used as a standard protocol for measuring elastic stiffness of living cells, since the measured values are intrinsic properties of the cells. © 2011 Elsevier Ltd.

  19. Visualization of interaction between ribosome-inactivating proteins and supercoiled DNA with an atomic force microscope

    Institute of Scientific and Technical Information of China (English)

    吴晓华; 刘望夷; 欧阳振乾; 李民乾

    1997-01-01

    The interaction between ribosome-inactivating proteins (RIPs) and supercoiled DNA was observed with an atomic force microscope (AFM). It was found that RIPs can bind to both supercoiled DNA and the unwound double stranded loop region in supercoiled DNA. The RIPs hound to the supercoils can induce the conformational change of supercoiled DNA. Furthermore, the supercoiled DNA was relaxed and cleaved into nick or linear form by RIPs. It indicated that RIP seemed to be a supercoil-dependent DNA binding protein and exhibited the activity of su-percoil-dependent DNA endonuclease.

  20. High resolution miniature dilatometer based on an atomic force microscope piezocantilever

    Energy Technology Data Exchange (ETDEWEB)

    Park, J.-H.; Graf, D.; Murphy, T. P.; Tozer, S. W. [National High Magnetic Field Laboratory, Florida State University, Tallahassee, Florida 32310 (United States); Schmiedeshoff, G. M. [Department of Physics, Occidental College, Los Angeles, California 90041 (United States)

    2009-11-15

    Thermal expansion, or dilation, is closely related to the specific heat, and provides useful information regarding material properties. The accurate measurement of dilation in confined spaces coupled with other limiting experimental environments such as low temperatures and rapidly changing high magnetic fields requires a new sensitive millimeter size dilatometer that has little or no temperature and field dependence. We have designed an ultracompact dilatometer using an atomic force microscope piezoresistive cantilever as the sensing element and demonstrated its versatility by studying the charge density waves in alpha uranium to high magnetic fields (up to 31 T). The performance of this piezoresistive dilatometer was comparable to that of a titanium capacitive dilatometer.

  1. Enhancing thermally induced effects on atomic force microscope cantilevers using optical microcavities

    Science.gov (United States)

    Duy Vy, Nguyen; Iida, Takuya

    2016-12-01

    A theory of enhancing thermally induced effects on atomic force microscope cantilevers with respect to the input power is proposed. An optical microcavity is used to increase the absorbed power and radiation pressure on thin films. We show that the response to the input power is enhanced up to an order of magnitude for cantilevers of ∼200 µm in length and ∼0.5 µm in thickness. A decrease in the absorbed power in the presence of cantilever deflection increases system endurability with respect to the input power. The study gives methods for amplifying and tuning vibration amplitudes in amplitude modulation modes with high sensitivity and low controlling input power.

  2. Aligning DNA on Si surface and cutting off by tips of atomic force microscope

    Institute of Scientific and Technical Information of China (English)

    2003-01-01

    DNA is a kind of promising molecule as nano-lead to build or connect nano-devices due to its stable linear structure and certain conductivity. Many methods have been applied to constructing nano-patterns by using DNA molecule. In this report it is presented that (-DNA was aligned on Si substrate by using the free-flowing method and then imaged by an atomic force microscope (AFM). After the second liquid flow, a catenary-like pattern and a crossed network of -DNA were formed. In addition, the aligned (-DNA was successfully cut off by tips of AFM.

  3. Development of novel and sensitive sensors based on microcantilever of atomic force microscope

    Institute of Scientific and Technical Information of China (English)

    JIN Yan; WANG Kemin; JIN Rong

    2006-01-01

    Recently, the development of sensors based on microfabricated cantilevers of atomic force microscope (AFM) has attracted considerable attention from the designers of novel physical, chemical, and biological sensors. Many kinds of sensors have been developed taking the advantages of its high-resolution imaging, force measurement and force sensitivity, such as immunosensor and DNA biosensor and the sensors for detection of intermolecular interaction. This paper reviews the progress made in this field and discusses the signal transfer principles by which the design of the sensors is achieved.

  4. Athermalization in atomic force microscope based force spectroscopy using matched microstructure coupling.

    Science.gov (United States)

    Torun, H; Finkler, O; Degertekin, F L

    2009-07-01

    The authors describe a method for athermalization in atomic force microscope (AFM) based force spectroscopy applications using microstructures that thermomechanically match the AFM probes. The method uses a setup where the AFM probe is coupled with the matched structure and the displacements of both structures are read out simultaneously. The matched structure displaces with the AFM probe as temperature changes, thus the force applied to the sample can be kept constant without the need for a separate feedback loop for thermal drift compensation, and the differential signal can be used to cancel the shift in zero-force level of the AFM.

  5. Experimental Investigation of the Velocity Effect on Adhesion Forces with an Atomic Force Microscope

    Institute of Scientific and Technical Information of China (English)

    魏征; 赵亚溥

    2004-01-01

    Capillary forces are significantly dominant in adhesive forces measured with an atomic force microscope (AFM)in ambient air, which are always thought to be dependent on water film thickness, relative humidity, and the free energy of water film. We study the nature of the pull-off force on a variety of surfaces as a function of tip velocity.It is found that the capillary forces are of relatively strong dependence on tip velocity. The present experiment is expected to provide a better understanding of the work mechanism of AFM in ambient air.

  6. Note: A novel atomic force microscope fast imaging approach: Variable-speed scanning

    Science.gov (United States)

    Zhang, Yudong; Fang, Yongchun; Yu, Jie; Dong, Xiaokun

    2011-05-01

    Imaging speed is one of the key factors limiting atomic force microscope's (AFM) wide applications. To improve its performance, a variable-speed scanning (VSS) method is designed in this note for an AFM. Specifically, in the VSS mode, the scanning speed is tuned online according to the feedback information to properly distribute imaging time along sample surface. Furthermore, some practical mechanism is proposed to determine the best time of moving the AFM tip to the next scanned point. The contrast experiment results show that the VSS method speeds up the imaging rate while ensuring image quality.

  7. 3D mechanical measurements with an atomic force microscope on 1D structures

    DEFF Research Database (Denmark)

    Kallesøe, Christian; Larsen, Martin Benjamin Barbour Spanget; Bøggild, Peter;

    2012-01-01

    We have developed a simple method to characterize the mechanical properties of three dimensional nanostructures, such as nanorods standing up from a substrate. With an atomic force microscope the cantilever probe is used to deflect a horizontally aligned nanorod at different positions along...... the nanorod, using the apex of the cantilever itself rather than the tip normally used for probing surfaces. This enables accurate determination of nanostructures' spring constant. From these measurements, Young's modulus is found on many individual nanorods with different geometrical and material structures...... in a short time. Based on this method Young's modulus of carbon nanofibers and epitaxial grown III-V nanowires has been determined....

  8. Track sensitivity and the surface roughness measurements of CR-39 with atomic force microscope

    CERN Document Server

    Yasuda, N; Amemiya, K; Takahashi, H; Kyan, A; Ogura, K

    1999-01-01

    Atomic Force Microscope (AFM) has been applied to evaluate the surface roughness and the track sensitivity of CR-39 track detector. We experimentally confirmed the inverse correlation between the track sensitivity and the roughness of the detector surface after etching. The surface of CR-39 (CR-39 doped with antioxidant (HARZLAS (TD-1)) and copolymer of CR-39/NIPAAm (TNF-1)) with high sensitivity becomes rough by the etching, while the pure CR-39 (BARYOTRAK) with low sensitivity keeps its original surface clarity even for the long etching.

  9. Building a multi-walled carbon nanotube-based mass sensor with the atomic force microscope

    DEFF Research Database (Denmark)

    Mateiu, Ramona Valentina; Kuhle, A.; Marie, Rodolphe Charly Willy;

    2005-01-01

    We report an approach for building a mass sensor based on multi-walled carbon nanotubes (MWCNT). We propose a method with a great potential for the positioning of MWCNTs based on self-assembly onto patterned hydrophilic areas. For the experiments ultra flat mica substrates covered with gold...... are used. The gold substrate is first covered with hydrophobic thiol molecules: octadecanthiol. The octadecanthiol molecules are then selectively removed from small areas by nanoshaving the gold substrate with the tip of an atomic force microscope (AFM) operating in contact mode. Hydrophilic thiols (2...

  10. Cellular replication and atomic force microscope imaging using a UV-Bioimprint technique.

    Science.gov (United States)

    Muys, J J; Alkaisi, M M; Evans, J J

    2006-09-01

    Replication and fixation techniques have been of considerable interest for imaging and analysis of biological cells since the introduction of electron and scanning probe microscopy. Although such tools as the atomic force microscope (AFM) permit in situ morphological studies at a magnitude of resolution beyond traditional optical microscopy, they are difficult to operate and their resolution capabilities are rarely realized. We used a UV-Bioimprint replication technique to imprint a polymer layer onto cells attached to a substrate and rapidly cure to create an impression of cell topography. Replicas of chemically fixed and untreated cells analyzed by atomic force microscopy demonstrate nanometer resolution in the transfer of replicated features. UV-Bioimprint presents an improvement over techniques using heat-curable polymers as well as an alternative technique to the direct imaging of cells. The motivation for UV-Bioimprint is to effectively integrate scanning probe microscopy tools for imaging of cellular ultrastructure.

  11. Surface features on Sahara soil dust particles made visible by atomic force microscope (AFM phase images

    Directory of Open Access Journals (Sweden)

    M. O. Andreae

    2008-10-01

    Full Text Available We show that atomic force microscopy (AFM phase images can reveal surface features of soil dust particles, which are not evident using other microscopic methods. The non-contact AFM method is able to resolve topographical structures in the nanometer range as well as to uncover repulsive atomic forces and attractive van der Waals' forces, and thus gives insight to surface properties. Though the method does not allow quantitative assignment in terms of chemical compound description, it clearly shows deposits of distinguishable material on the surface. We apply this technique to dust aerosol particles from the Sahara collected over the Atlantic Ocean and describe micro-features on the surfaces of such particles.

  12. Surface features on Sahara soil dust particles made visible by atomic force microscope (AFM phase images

    Directory of Open Access Journals (Sweden)

    G. Helas

    2008-08-01

    Full Text Available We show that atomic force microscopy (AFM phase images can reveal surface features of soil dust particles, which are not evident using other microscopic methods. The non-contact AFM method is able to resolve topographical structures in the nanometer range as well as to uncover repulsive atomic forces and attractive van der Waals' forces, and thus gives insight to surface properties. Though the method does not allow quantitative assignment in terms of chemical compound description, it clearly shows deposits of distinguishable material on the surface. We apply this technique to dust aerosol particles from the Sahara collected over the Atlantic Ocean and describe micro-features on the surfaces of such particles.

  13. Mapping Atomic Orbitals with the Transmission Electron Microscope: Images of Defective Graphene Predicted from First-Principles Theory.

    Science.gov (United States)

    Pardini, Lorenzo; Löffler, Stefan; Biddau, Giulio; Hambach, Ralf; Kaiser, Ute; Draxl, Claudia; Schattschneider, Peter

    2016-07-15

    Transmission electron microscopy has been a promising candidate for mapping atomic orbitals for a long time. Here, we explore its capabilities by a first-principles approach. For the example of defected graphene, exhibiting either an isolated vacancy or a substitutional nitrogen atom, we show that three different kinds of images are to be expected, depending on the orbital character. To judge the feasibility of visualizing orbitals in a real microscope, the effect of the optics' aberrations is simulated. We demonstrate that, by making use of energy filtering, it should indeed be possible to map atomic orbitals in a state-of-the-art transmission electron microscope.

  14. Re-calibration of the NIST SRM 2059 master standard using traceable atomic force microscope metrology

    Science.gov (United States)

    Dixson, Ronald; Potzick, James; Orji, Ndubuisi G.

    2008-10-01

    The current photomask linewidth Standard Reference Material (SRM) supplied by the National Institute of Standards and Technology (NIST), SRM 2059, is the fifth generation of such standards for mask metrology. An in house optical microscope tool developed at NIST, called the NIST ultra-violet (UV) microscope, was used in transmission mode to calibrate the SRM 2059 photomasks. Due to the limitations of available optical models for determining the edge response in the UV microscope, the tool was used in a comparator mode. One of the masks was selected as a master standard - and the features on this mask were calibrated using traceable critical dimension atomic force microscope (CD-AFM) dimensional metrology. The optical measurements were then used to determine the relative offsets between the widths on the master standard and individual masks for sale to customers. At the time of these measurements, however, the uncertainties in the CD-AFM reference metrology on the master standard were larger than can now be achieved because the NIST single crystal critical dimension reference material (SCCDRM) project had not been completed. Using our CD-AFM at NIST, we have performed new measurements on the SRM 2059 master standard. The new AFM results are in agreement with the prior measurements and have expanded uncertainties approximately one fourth of those of the earlier results for sub-micrometer features. When the optical comparator data for customers masks are reanalyzed using these new AFM results, we expect to reduce the combined reported uncertainties for the linewidths on the actual SRMs by at least 40 % for the nominal 0.25 μm features.

  15. Indirect identification and compensation of lateral scanner resonances in atomic force microscopes.

    Science.gov (United States)

    Burns, D J; Youcef-Toumi, K; Fantner, G E

    2011-08-05

    Improving the imaging speed of atomic force microscopy (AFM) requires accurate nanopositioning at high speeds. However, high speed operation excites resonances in the AFM's mechanical scanner that can distort the image, and therefore typical users of commercial AFMs elect to operate microscopes at speeds below which scanner resonances are observed. Although traditional robust feedforward controllers and input shaping have proven effective at minimizing the influence of scanner distortions, the lack of direct measurement and use of model-based controllers have required disassembling the microscope to access lateral scanner motion with external sensors in order to perform a full system identification experiment, which places excessive demands on routine microscope operators. Further, since the lightly damped instrument dynamics often change from experiment to experiment, model-based controllers designed from offline system identification experiments must trade off high speed performance for robustness to modeling errors. This work represents a new way to automatically characterize the lateral scanner dynamics without addition of lateral sensors, and shape the commanded input signals in such a way that disturbing dynamics are not excited. Scanner coupling between the lateral and out-of-plane directions is exploited and used to build a minimal model of the scanner that is also sufficient to describe the nature of the distorting resonances. This model informs the design of an online input shaper used to suppress spectral components of the high speed command signals. The method presented is distinct from alternative approaches in that neither an information-complete system identification experiment nor microscope modification are required. Because the system identification is performed online immediately before imaging, no tradeoff of performance is required. This approach has enabled an increase in the scan rates of unmodified commercial AFMs from 1-4 lines s(-1) to

  16. 'Sub-atomic' resolution of non-contact atomic force microscope images induced by a heterogeneous tip structure: a density functional theory study.

    Science.gov (United States)

    Campbellová, Anna; Ondráček, Martin; Pou, Pablo; Pérez, Rubén; Klapetek, Petr; Jelínek, Pavel

    2011-07-22

    A Si adatom on a Si(111)-(7 × 7) reconstructed surface is a typical atomic feature that can rather easily be imaged by a non-contact atomic force microscope (nc-AFM) and can be thus used to test the atomic resolution of the microscope. Based on our first principles density functional theory (DFT) calculations, we demonstrate that the structure of the termination of the AFM tip plays a decisive role in determining the appearance of the adatom image. We show how the AFM image changes depending on the tip-surface distance and the composition of the atomic apex at the end of the tip. We also demonstrate that contaminated tips may give rise to image patterns displaying so-called 'sub-atomic' features even in the attractive force regime.

  17. A high-pressure atomic force microscope for imaging in supercritical carbon dioxide

    Energy Technology Data Exchange (ETDEWEB)

    Lea, A. S.; Higgins, S. R.; Knauss, K. G.; Rosso, K. M.

    2011-01-01

    A high-pressure atomic force microscope(AFM) that enables in situ, atomic scale measurements of topography of solid surfaces in contact with supercritical CO2 (scCO2) fluids has been developed. This apparatus overcomes the pressure limitations of the hydrothermal AFM and is designed to handle pressures up to 100 atm at temperatures up to ~350 K. A standard optically-based cantilever deflection detection system was chosen. When imaging in compressible supercritical fluids such as scCO2, precise control of pressure and temperature in the fluid cell is the primary technical challenge. Noise levels and imaging resolution depend on minimization of fluid density fluctuations that change the fluidrefractive index and hence the laser path. We demonstrate with our apparatus in situ atomic scale imaging of a calcite (CaCO3) mineral surface in scCO2; both single, monatomic steps and dynamic processes occurring on the (101¯4) surface are presented. Finally, this new AFM provides unprecedented in situ access to interfacial phenomena at solid–fluid interfaces under pressure.

  18. Biophysical Measurements of Cells, Microtubules, and DNA with an Atomic Force Microscope

    CERN Document Server

    Devenica, Luka M; Cabrejo, Raysa; Kurek, Matthew; Deveney, Edward F; Carter, Ashley R

    2015-01-01

    Atomic force microscopes (AFMs) are ubiquitous in research laboratories and have recently been priced for use in teaching laboratories. Here we review several AFM platforms (Dimension 3000 by Digital Instruments, EasyScan2 by Nanosurf, ezAFM by Nanomagnetics, and TKAFM by Thorlabs) and describe various biophysical experiments that could be done in the teaching laboratory using these instruments. In particular, we focus on experiments that image biological materials and quantify biophysical parameters: 1) imaging cells to determine membrane tension, 2) imaging microtubules to determine their persistence length, 3) imaging the random walk of DNA molecules to determine their contour length, and 4) imaging stretched DNA molecules to measure the tensional force.

  19. Nanotribological characterization of digital micromirror devices using an atomic force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Liu Huiwen; Bhushan, Bharat

    2004-08-15

    Texas Instruments' digital micromirror device (DMD) comprises an array of fast digital micromirrors, monolithically integrated onto and controlled by an underlying silicon memory chip. The DMD is one of the few success stories in the emerging field of MEMS. In this study, an atomic force microscope (AFM) has been used to characterize the nanotribological properties of the elements of the DMD. An AFM methodology was developed to identify and remove micromirrors of interest. The surface roughness, adhesion, friction, and stiffness properties of the DMD elements were studied. The influence of relative humidity and temperature on the behavior of the DMD element surfaces was also investigated. Potential mechanisms for wear and stiction are discussed in light of the findings.

  20. Quantitative measurements of electromechanical response with a combined optical beam and interferometric atomic force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Labuda, Aleksander; Proksch, Roger [Asylum Research an Oxford Instruments Company, Santa Barbara, California 93117 (United States)

    2015-06-22

    An ongoing challenge in atomic force microscope (AFM) experiments is the quantitative measurement of cantilever motion. The vast majority of AFMs use the optical beam deflection (OBD) method to infer the deflection of the cantilever. The OBD method is easy to implement, has impressive noise performance, and tends to be mechanically robust. However, it represents an indirect measurement of the cantilever displacement, since it is fundamentally an angular rather than a displacement measurement. Here, we demonstrate a metrological AFM that combines an OBD sensor with a laser Doppler vibrometer (LDV) to enable accurate measurements of the cantilever velocity and displacement. The OBD/LDV AFM allows a host of quantitative measurements to be performed, including in-situ measurements of cantilever oscillation modes in piezoresponse force microscopy. As an example application, we demonstrate how this instrument can be used for accurate quantification of piezoelectric sensitivity—a longstanding goal in the electromechanical community.

  1. Influence of atomic force microscope (AFM) probe shape on adhesion force measured in humidity environment

    Institute of Scientific and Technical Information of China (English)

    阳丽; 涂育松; 谭惠丽

    2014-01-01

    In micro-manipulation, the adhesion force has very important influence on behaviors of micro-objects. Here, a theoretical study on the effects of humidity on the adhesion force is presented between atomic force microscope (AFM) tips and substrate. The analysis shows that the precise tip geometry plays a critical role on humidity depen-dence of the adhesion force, which is the dominant factor in manipulating micro-objects in AFM experiments. For a blunt (paraboloid) tip, the adhesion force versus humidity curves tends to the apparent contrast (peak-to-valley corrugation) with a broad range. This paper demonstrates that the abrupt change of the adhesion force has high correla-tion with probe curvatures, which is mediated by coordinates of solid-liquid-vapor contact lines (triple point) on the probe profiles. The study provides insights for further under-standing nanoscale adhesion forces and the way to choose probe shapes in manipulating micro-objects in AFM experiments.

  2. Invited Review Nanoscale devices fabricated by dynamic ploughing with an atomic force microscope

    Science.gov (United States)

    Kunze, Ulrich

    2002-01-01

    A review is given on the dynamic ploughing technique and its application on the fabrication of nanoscale semiconductor structures. The vibrating tip of an atomic force microscope is used to dynamically plough furrows into a polymer layer of a few nm thickness on top of the semiconductor surface. Wet-chemical etching transfers the desired line pattern. The resulting grooves of 50-100 nm width form an arrangement of barriers in the electron layer of a conventional modulation-doped GaAs/AlGaAs heterostructure. A new type of heterostructure with a compensating p-type doped cap layer shows an electron enhancement if the cap layer is selectively removed. Etching a groove in these structures enables one to induce a one-dimensional electron system. Both types of structures are used to fabricate various ballistic quantum devices and Coulomb-blockade structures.

  3. Atomic force microscope observation of branching in single transcript molecules derived from human cardiac muscle

    Energy Technology Data Exchange (ETDEWEB)

    Reed, Jason; Hsueh, Carlin; Gimzewski, James K [Department of Chemistry and Biochemistry, UCLA, 607 Charles Young Drive East, Los Angeles, CA 90095 (United States); Mishra, Bud [Courant Institute of Mathematical Sciences, NYU, 251 Mercer Street, New York, NY 10012 (United States)], E-mail: jreed@chem.ucla.edu, E-mail: gim@chem.ucla.edu

    2008-09-24

    We have used an atomic force microscope to examine a clinically derived sample of single-molecule gene transcripts, in the form of double-stranded cDNA, (c: complementary) obtained from human cardiac muscle without the use of polymerase chain reaction (PCR) amplification. We observed a log-normal distribution of transcript sizes, with most molecules being in the range of 0.4-7.0 kilobase pairs (kb) or 130-2300 nm in contour length, in accordance with the expected distribution of mRNA (m: messenger) sizes in mammalian cells. We observed novel branching structures not previously known to exist in cDNA, and which could have profound negative effects on traditional analysis of cDNA samples through cloning, PCR and DNA sequencing.

  4. Surface topography characterization using an atomic force microscope mounted on a coordinate measuring machine

    DEFF Research Database (Denmark)

    De Chiffre, Leonardo; Hansen, H.N; Kofod, N

    1999-01-01

    The paper describes the construction, testing and use of an integrated system for topographic characterization of fine surfaces on parts having relatively big dimensions. An atomic force microscope (AFM) was mounted on a manual three-coordinate measuring machine (CMM) achieving free positioning o...... areas traced in single scans of 40 mu m x 40 mu m. The results show that surface mapping on industrial surfaces is possible using the Least Mean Square alignment provided by the AFM software....... values in the order of 1 nm. The positioning repeatability of the two horizontal axes of the CMM was determined to +/-1 mu m. Sets of four 20 mu m x 20 mu m areas were traced on fiat objects, combining the data into single 40 mu m x 40 mu m areas, and comparing the roughness values to those for the same...

  5. Scanning thermal microscopy based on a modified atomic force microscope combined with pyroelectric detection

    Science.gov (United States)

    Antoniow, J.-S.; Chirtoc, M.; Trannoy, N.; Raphael, O.; Pelzl, J.

    2005-06-01

    We propose a novel approach in scanning thermal microscopy of layered samples. The thermal probe (ThP) (Wollaston wire) acts as a local a.c. heat source at the front of a sample layer deposited on a pyroelectric (PE) sensor. The PE signal is proportional to the heat wave transmitted through the sample. The ThP and PE signals can be used to generate complementary thermal conductivity maps and with some restrictions, thermal diffusivity maps of the sample. Additionally, the topography map is obtained in the usual way from the atomic force microscope. We give the theoretical background for the interpretation of PE signal obtained at low and at high frequency, and we demonstrate that it carries information on the thermal diffusivity of a test sample (12 μm thick PET polymer sheet). Finally, we discuss the contributions of heat transfer channels between ThP and sample, and the role of contact thermal resistance.

  6. Nanometer-scale lithography of ultrathin films with atomic force microscope

    CERN Document Server

    Kim, J C; Shin, Y W; Park, S W

    1998-01-01

    Ultrathin resist films have been prepared by both Langmuir-Blodgett (LB) and self-assembly (SA) techniques. Nanometer-scale patterning of these thin films has been performed by using the atomic force microscope (AFM) as the exposing tool. The poly (methylphenylmethacrylate) (PMPMA) LB films were prepared and fabricated by AFM lithography. When the exposure was carried out at the bias voltage of -25V, the protruding lines appeared in the exposed regions. The preoptimized LB films at various conditions exhibited 120 nm line resolution. An organosilane monolayer composed of octadecyldimethylsilyl groups was prepared on a Si substrate. It was then patterned through the localized degradation of the monolayer due to anodic reaction induced by an AFM tip. When the bias voltage was -30 V, the protruding lines appeared in the exposed regions.

  7. Investigation of penetration force of living cell using an atomic force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Kwon, Eun Young; Kim, Young Tae; Kim, Dae Eun [Yonsei University, Seoul (Korea, Republic of)

    2009-07-15

    Recently, the manipulation of a single cell has been receiving much attention in transgenesis, in-vitro fertilization, individual cell based diagnosis, and pharmaceutical applications. As these techniques require precise injection and manipulation of cells, issues related to penetration force arise. In this work the penetration force of living cell was studied using an atomic force microscope (AFM). L929, HeLa, 4T1, and TA3 HA II cells were used for the experiments. The results showed that the penetration force was in the range of 2{approx}22 nN. It was also found that location of cell penetration and stiffness of the AFM cantilever affected the penetration force significantly. Furthermore, double penetration events could be detected, due to the multi-membrane layers of the cell. The findings of this work are expected to aid in the development of precision micro-medical instruments for cell manipulation and treatment

  8. A virtual instrument to standardise the calibration of atomic force microscope cantilevers

    CERN Document Server

    Sader, John E; Gibson, Christopher T; Haviland, David B; Higgins, Michael J; Kilpatrick, Jason I; Lu, Jianing; Mulvaney, Paul; Shearer, Cameron J; Slattery, Ashley D; Thorén, Per-Anders; Tran, Jim; Zhang, Heyou; Zhang, Hongrui; Zheng, Tian

    2016-01-01

    Atomic force microscope (AFM) users often calibrate the spring constants of cantilevers using functionality built into individual instruments. This is performed without reference to a global standard, which hinders robust comparison of force measurements reported by different laboratories. In this article, we describe a virtual instrument (an internet-based initiative) whereby users from all laboratories can instantly and quantitatively compare their calibration measurements to those of others - standardising AFM force measurements - and simultaneously enabling non-invasive calibration of AFM cantilevers of any geometry. This global calibration initiative requires no additional instrumentation or data processing on the part of the user. It utilises a single website where users upload currently available data. A proof-of-principle demonstration of this initiative is presented using measured data from five independent laboratories across three countries, which also allows for an assessment of current calibratio...

  9. Theoretical Study on the Capillary Force between an Atomic Force Microscope Tip and a Nanoparticle

    Institute of Scientific and Technical Information of China (English)

    LI Zhao-Xia; ZHANG Li-Juan; YI Hou-Hui; FANG Hai-Ping

    2007-01-01

    @@ Considering that capillary force is one of the most important forces between nanoparticles and atomic force microscope (AFM) tips in ambient atmosphere, we develop an analytic approach on the capillary force between an AFM tip and a nanoparticle. The results show that the capillary forces are considerably affected by the geometry of the AFM tip, the humidity of the environment, the vertical distance between the AFM tip and the nanoparticle, as well as the contact angles of the meniscus with an AFM tip and a nanoparticle. It is found that the sharper the AFM tip, the smaller the capillary force. The analyses and results are expected to be helpful for the quantitative imaging and manipulating of nanoparticles by AFMs.

  10. Observation on Surface and Cross Section of Thin Film Solar Cells Using Atomic Force Microscope

    Institute of Scientific and Technical Information of China (English)

    FENG Liang-huan; WU Li-li; CAI Wei; CAI Ya-ping; ZHENG Jia-gui; ZHANG Jing-quan; LI Bing; LI Wei

    2005-01-01

    Atomic force microscope (AFM) is able to produce three-dimensional digital data in both forcemode and height-mode and its applications are not limited to map the surfaces of conducting materials. It can use the force-mode to image the repulsive and attractive force patterns. The cross sections of polycrystalline CdS/CdTe and amorphous silicon heterojunction solar cells are observed with AFM. In case of short circuit,the microstructures of different layers in the samples are clearly displayed. When the cells are open circuit, the topographical images are altered, the potential outline due to the space charge in junction region is observed.Obviously, AFM can be employed to investigate experimentally built-in potential in junction of semiconductor devices, such as solar cells.

  11. An open source/real-time atomic force microscope architecture to perform customizable force spectroscopy experiments.

    Science.gov (United States)

    Materassi, Donatello; Baschieri, Paolo; Tiribilli, Bruno; Zuccheri, Giampaolo; Samorì, Bruno

    2009-08-01

    We describe the realization of an atomic force microscope architecture designed to perform customizable experiments in a flexible and automatic way. Novel technological contributions are given by the software implementation platform (RTAI-LINUX), which is free and open source, and from a functional point of view, by the implementation of hard real-time control algorithms. Some other technical solutions such as a new way to estimate the optical lever constant are described as well. The adoption of this architecture provides many degrees of freedom in the device behavior and, furthermore, allows one to obtain a flexible experimental instrument at a relatively low cost. In particular, we show how such a system has been employed to obtain measures in sophisticated single-molecule force spectroscopy experiments [Fernandez and Li, Science 303, 1674 (2004)]. Experimental results on proteins already studied using the same methodologies are provided in order to show the reliability of the measure system.

  12. Real time drift measurement for colloidal probe atomic force microscope: a visual sensing approach

    Energy Technology Data Exchange (ETDEWEB)

    Wang, Yuliang, E-mail: wangyuliang@buaa.edu.cn; Bi, Shusheng [Robotics Institute, School of Mechanical Engineering and Automation, Beihang University, Beijing 100191 (China); Wang, Huimin [Department of Materials Science and Engineering, The Ohio State University, 2041 College Rd., Columbus, OH 43210 (United States)

    2014-05-15

    Drift has long been an issue in atomic force microscope (AFM) systems and limits their ability to make long time period measurements. In this study, a new method is proposed to directly measure and compensate for the drift between AFM cantilevers and sample surfaces in AFM systems. This was achieved by simultaneously measuring z positions for beads at the end of an AFM colloidal probe and on sample surface through an off-focus image processing based visual sensing method. The working principle and system configuration are presented. Experiments were conducted to validate the real time drift measurement and compensation. The implication of the proposed method for regular AFM measurements is discussed. We believe that this technique provides a practical and efficient approach for AFM experiments requiring long time period measurement.

  13. Serum induced degradation of 3D DNA box origami observed by high speed atomic force microscope

    DEFF Research Database (Denmark)

    Jiang, Zaixing; Zhang, Shuai; Yang, Chuanxu;

    2015-01-01

    3D DNA origami holds tremendous potential to encapsulate and selectively release therapeutic drugs. Observations of real-time performance of 3D DNA origami structures in physiological environment will contribute much to its further applications. Here, we investigate the degradation kinetics of 3D...... DNA box origami in serum using high-speed atomic force microscope optimized for imaging 3D DNA origami in real time. The time resolution allows characterizing the stages of serum effects on individual 3D DNA box origami with nanometer resolution. Our results indicate that the whole digest process...... is a combination of a rapid collapse phase and a slow degradation phase. The damages of box origami mainly happen in the collapse phase. Thus, the structure stability of 3D DNA box origami should be further improved, especially in the collapse phase, before clinical applications...

  14. Design of mechanical components for vibration reduction in an atomic force microscope.

    Science.gov (United States)

    Kim, Chulsoo; Jung, Jongkyu; Youm, Woosub; Park, Kyihwan

    2011-03-01

    Vibration is a key factor to be considered when designing the mechanical components of a high precision and high speed atomic force microscope (AFM). It is required to design the mechanical components so that they have resonant frequencies higher than the external and internal vibration frequencies. In this work, the mechanical vibration in a conventional AFM system is analyzed by considering its mechanical components, and a vibration reduction is then achieved by reconfiguring the mechanical components. To analyze the mechanical vibration, a schematic of the lumped model of the AFM system is derived and the vibrational influences of the AFM components are experimentally examined. Based on this vibration analysis, a reconfigured AFM system is proposed and its effects are compared to a conventional system through a series of simulations and experiments.

  15. Site-controlled quantum dots fabricated using an atomic-force microscope assisted technique

    Directory of Open Access Journals (Sweden)

    Sakuma Y

    2006-01-01

    Full Text Available AbstractAn atomic-force microscope assisted technique is developed to control the position and size of self-assembled semiconductor quantum dots (QDs. Presently, the site precision is as good as ± 1.5 nm and the size fluctuation is within ± 5% with the minimum controllable lateral diameter of 20 nm. With the ability of producing tightly packed and differently sized QDs, sophisticated QD arrays can be controllably fabricated for the application in quantum computing. The optical quality of such site-controlled QDs is found comparable to some conventionally self-assembled semiconductor QDs. The single dot photoluminescence of site-controlled InAs/InP QDs is studied in detail, presenting the prospect to utilize them in quantum communication as precisely controlled single photon emitters working at telecommunication bands.

  16. Direct observation of phase transition of GeSbTe thin films by Atomic Force Microscope

    Energy Technology Data Exchange (ETDEWEB)

    Yang Fei [National Laboratory of Solid State Microstructures and Jiangsu Provincial Key Laboratory of Photonic and Electronic Materials Sciences and Technology, School of Electronic Science and Engineering, Nanjing University, Nanjing 210093 (China); Xu Ling, E-mail: xuling@nju.edu.cn [National Laboratory of Solid State Microstructures and Jiangsu Provincial Key Laboratory of Photonic and Electronic Materials Sciences and Technology, School of Electronic Science and Engineering, Nanjing University, Nanjing 210093 (China); Zhang Rui; Geng Lei; Tong Liang; Xu Jun [National Laboratory of Solid State Microstructures and Jiangsu Provincial Key Laboratory of Photonic and Electronic Materials Sciences and Technology, School of Electronic Science and Engineering, Nanjing University, Nanjing 210093 (China); Su Weining; Yu Yao [National Laboratory of Solid State Microstructures and Department of Physics, Nanjing University, Nanjing 210093 (China); Ma Zhongyuan; Chen Kunji [National Laboratory of Solid State Microstructures and Jiangsu Provincial Key Laboratory of Photonic and Electronic Materials Sciences and Technology, School of Electronic Science and Engineering, Nanjing University, Nanjing 210093 (China)

    2012-10-01

    Graphical abstract: Nano-sized marks on GST thin film were fabricated using Conductive-AFM (Atomic Force Microscope). The AFM morphology images show that the marks are ablated at the center and a raised ring surrounding it. Highlights: Black-Right-Pointing-Pointer Microstructure of GeSbTe thin films was characterized by XRD and AFM. Black-Right-Pointing-Pointer Annealing and applying electrical field can induce crystallization on thin film. Black-Right-Pointing-Pointer Conductive-AFM was used to modify the surface of GeSbTe thin film. - Abstract: GeSbTe (GST) thin films were deposited on quartz substrates using electron beam evaporation system and then annealed in nitrogen atmosphere at different temperatures, ranging from 20 Degree-Sign C to 300 Degree-Sign C. X-ray diffraction (XRD) and Atomic Force microscope (AFM) measurements were used to characterize the as-deposited and post-annealed thin films. Annealing treatment was found to induce changes on microstructure, surface roughness and grain size, indicating that with the increase of annealing temperature, the amorphous GST films first changed to face-centered-cubic (fcc) phase and then the stable hexagonal (hex) phase. Meanwhile, conductive-AFM (C-AFM) was used to produce crystallized GST dots on thin films. I-V spectroscopy results show that GST films can switch from amorphous state to crystalline state at threshold voltage. After switching, I-V curve exhibits ohmic characteristic, which is usually observed in crystallized GST films. By applying repeated I-V spectroscopies on the thin films, crystallized nuclei were observed. As the times of I-V spectroscopies increases, the area of written dots increases, and the center of the mark begin to ablate. The AFM images show that the shape of marks is an ablated center with a raised ring surrounding it.

  17. Development of a Hybrid Atomic Force Microscopic Measurement System Combined with White Light Scanning Interferometry

    Directory of Open Access Journals (Sweden)

    Xiaotang Hu

    2011-12-01

    Full Text Available A hybrid atomic force microscopic (AFM measurement system combined with white light scanning interferometry for micro/nanometer dimensional measurement is developed. The system is based on a high precision large-range positioning platform with nanometer accuracy on which a white light scanning interferometric module and an AFM head are built. A compact AFM head is developed using a self-sensing tuning fork probe. The head need no external optical sensors to detect the deflection of the cantilever, which saves room on the head, and it can be directly fixed under an optical microscopic interferometric system. To enhance the system’s dynamic response, the frequency modulation (FM mode is adopted for the AFM head. The measuring data can be traceable through three laser interferometers in the system. The lateral scanning range can reach 25 mm × 25 mm by using a large-range positioning platform. A hybrid method combining AFM and white light scanning interferometry is proposed to improve the AFM measurement efficiency. In this method, the sample is measured firstly by white light scanning interferometry to get an overall coarse morphology, and then, further measured with higher resolution by AFM. Several measuring experiments on standard samples demonstrate the system’s good measurement performance and feasibility of the hybrid measurement method.

  18. A versatile atomic force microscope for three-dimensional nanomanipulation and nanoassembly

    Energy Technology Data Exchange (ETDEWEB)

    Xie Hui; Haliyo, Dogan Sinan; Regnier, Stephane [Institut des Systemes Intelligents et de Robotique, Universite Pierre et Marie Curie/CNRS UMR7222, BC 173, 4 Place Jussieu, F-75005 Paris (France)], E-mail: xie@robot.jussieu.fr

    2009-05-27

    A conventional atomic force microscope (AFM) has been successfully applied to manipulating nanoparticles (zero-dimensional), nanowires (one-dimensional) or nanotubes (one- or two-dimensional) by widely used pushing or pulling operations on a single surface. However, pick-and-place nanomanipulation in air is still a challenge. In this research, a modified AFM, called a three-dimensional (3D) manipulation force microscope (3DMFM), was developed to realize 3D nanomanipulation in air. This system consists of two individually actuated cantilevers with protruding tips that are facing each other, constructing a nanotweezer for the pick-and-place nanomanipulation. Before manipulation, one of the cantilevers is employed to position nano-objects and locate the tip of the other cantilever by image scanning. During the manipulation, these two cantilevers work collaboratively as a nanotweezer to grasp, transport and place the nano-objects with real-time force sensing. The manipulation capabilities of the nanotweezer were demonstrated by grabbing and manipulating silicon nanowires to build 3D nanowire crosses. 3D nanomanipulation and nanoassembly performed in air could become feasible through this newly developed 3DMFM.

  19. Microscopic phase-field simulation of atomic site occupation in ordering process of NiAl9Fe6 alloy

    Institute of Scientific and Technical Information of China (English)

    LIANG Min-jie; CHEN Zheng; ZHANG Ji-xiang; WANG Yong-xin

    2008-01-01

    The process of γ(fcc)→γ(fcc)+γ'(L12) phase transformation was simulated by using microscopic phase-field method for the low supersaturation NiAl9Fe6 alloy. It is found that in the γ' phase, the ordering degree of Al atoms is obviously higher than that of Fe atoms, and the ordering of Al atoms precedes their clustering, while the case of Fe atoms is opposite. The α site is mainly occupied by Ni atoms, while the β site is occupied in common by Al, Fe and Ni atoms. At order-disorder interphase boundary, the ordering degree of Al atoms is higher than that of Fe atoms, and at the β site, the Fe atomic site occupation probabilities vary from high to low during ordering; the Al atomic site occupation probabilities are similar to those of Fe atoms, but their values are much higher than those of Fe atoms; Ni atoms are opposite to both of them. Meanwhile, during the ordering transformation, γ' phase is always a complex Ni3(AlFeNi) single-phase, and it is precipitated by the non-classical nucleation and growth style. Finally, in the alloy system, the volume of γ' ordered phase is less than that of γ phase, and the volume ratio of order to disorder is about 77%.

  20. High-speed atomic force microscope based on an astigmatic detection system

    Energy Technology Data Exchange (ETDEWEB)

    Liao, H.-S.; Chen, Y.-H.; Hwu, E.-T.; Chang, C.-S.; Hwang, I.-S., E-mail: ishwang@phys.sinica.edu.tw [Institute of Physics, Academia Sinica, Nankang, Taipei 11529, Taiwan (China); Ding, R.-F.; Huang, H.-F.; Wang, W.-M. [Institute of Physics, Academia Sinica, Nankang, Taipei 11529, Taiwan (China); Department of Mechanical Engineering, National Taiwan University, Taipei 10617, Taiwan (China); Huang, K.-Y. [Department of Mechanical Engineering, National Taiwan University, Taipei 10617, Taiwan (China)

    2014-10-15

    High-speed atomic force microscopy (HS-AFM) enables visualizing dynamic behaviors of biological molecules under physiological conditions at a temporal resolution of 1s or shorter. A small cantilever with a high resonance frequency is crucial in increasing the scan speed. However, detecting mechanical resonances of small cantilevers is technically challenging. In this study, we constructed an atomic force microscope using a digital versatile disc (DVD) pickup head to detect cantilever deflections. In addition, a flexure-guided scanner and a sinusoidal scan method were implemented. In this work, we imaged a grating sample in air by using a regular cantilever and a small cantilever with a resonance frequency of 5.5 MHz. Poor tracking was seen at the scan rate of 50 line/s when a cantilever for regular AFM imaging was used. Using a small cantilever at the scan rate of 100 line/s revealed no significant degradation in the topographic images. The results indicate that a smaller cantilever can achieve a higher scan rate and superior force sensitivity. This work shows the potential for using a DVD pickup head in future HS-AFM technology.

  1. Comparison of line width calibration using critical dimension atomic force microscopes between PTB and NIST

    Science.gov (United States)

    Dai, Gaoliang; Hahm, Kai; Bosse, Harald; Dixson, Ronald G.

    2017-06-01

    International comparisons between National Metrology Institutes are important to verify measurement results and the associated uncertainties. In this paper, we report a comparison of the line width calibration of a crystalline silicon line width standard, referred to as IVPS100-PTB standard, between the Physikalisch-Technische Bundesanstalt in Germany and the National Institute of Standards and Technology in the United States. Critical dimension atomic force microscopy was the measurement method used for this comparison. Both institutes applied generally the same but independently developed traceability pathways: the scaling factor of the atomic force microscope (AFM) scanner was calibrated by a set of step height and lateral standards certified by metrological AFMs, while the effective tip width was ultimately traceable to the lattice parameter of silicon via high resolution transmission electron microscopy. Good agreement has been achieved in the comparison: For two groups of line features with nominal critical dimensions (CDs) of 50 nm, 70 nm, 90 nm, 110 nm and 130 nm that were compared, the observed deviations of CD results were between  -1.5 nm and 0.3 nm. The deviations are well within the associated measurement uncertainty.

  2. A Computer-Controlled Classroom Model of an Atomic Force Microscope

    Science.gov (United States)

    Engstrom, Tyler A.; Johnson, Matthew M.; Eklund, Peter C.; Russin, Timothy J.

    2015-12-01

    The concept of "seeing by feeling" as a way to circumvent limitations on sight is universal on the macroscopic scale—reading Braille, feeling one's way around a dark room, etc. The development of the atomic force microscope (AFM) in 1986 extended this concept to imaging in the nanoscale. While there are classroom demonstrations that use a tactile probe to map the topography or some other property of a sample, the rastering of the probe over the sample is manually controlled, which is both tedious and potentially inaccurate. Other groups have used simulation or tele-operation of an AFM probe. In this paper we describe a teaching AFM with complete computer control to map out topographic and magnetic properties of a "crystal" consisting of two-dimensional arrays of spherical marble "atoms." Our AFM is well suited for lessons on the "Big Ideas of Nanoscale" such as tools and instrumentation, as well as a pre-teaching activity for groups with remote access AFM or mobile AFM. The principle of operation of our classroom AFM is the same as that of a real AFM, excepting the nature of the force between sample and probe.

  3. Atomic-Scale Study Of Complex Cobalt Oxide Using Scanning Transmission Electron Microscope

    Science.gov (United States)

    Gulec, Ahmet

    Cobalt oxides offer a rich ?eld for the formation of novel phases, including superconductors and exotic magnetic phases, involving a mixed valence state for cobalt and/or the presence of oxygen vacancies. Having spin states, such as, low spin (LS), high spin (HS), and intermediate spin (IS), cobalt oxides differ from other 3d metal oxides The presence of such spin states make the physics of the cobalt oxides so complicated that it has not yet been completely understood. In order to improve our understanding of the various phase transitions observed in Cobalt oxides and to comprehend the relationship between crystal and electronic structure, both high energy resolution and high spatial resolution are essential. Fortunately, transmission electron microscopy (TEM) is a technique which is capable of ful?lling both of these requirements. In this thesis, I have utilized unique techniques in a scanning transmission electron microscope (STEM) to analyze the atomic-scale structure-property relationship, both at room temperature and through insitu cooling to liquid nitrogen (LN2) temperature. In particular, by using correlated Z-contrast imaging, electron energy loss spectrum (EELS) and electron energy loss magnetic circular dichroism (EMCD), the structure, composition, bonding and magnetic behavior are characterized directly on the atomic scale.

  4. Imaging single atoms using secondary electrons with an aberration-corrected electron microscope.

    Science.gov (United States)

    Zhu, Y; Inada, H; Nakamura, K; Wall, J

    2009-10-01

    Aberration correction has embarked on a new frontier in electron microscopy by overcoming the limitations of conventional round lenses, providing sub-angstrom-sized probes. However, improvement of spatial resolution using aberration correction so far has been limited to the use of transmitted electrons both in scanning and stationary mode, with an improvement of 20-40% (refs 3-8). In contrast, advances in the spatial resolution of scanning electron microscopes (SEMs), which are by far the most widely used instrument for surface imaging at the micrometre-nanometre scale, have been stagnant, despite several recent efforts. Here, we report a new SEM, with aberration correction, able to image single atoms by detecting electrons emerging from its surface as a result of interaction with the small probe. The spatial resolution achieved represents a fourfold improvement over the best-reported resolution in any SEM (refs 10-12). Furthermore, we can simultaneously probe the sample through its entire thickness with transmitted electrons. This ability is significant because it permits the selective visualization of bulk atoms and surface ones, beyond a traditional two-dimensional projection in transmission electron microscopy. It has the potential to revolutionize the field of microscopy and imaging, thereby opening the door to a wide range of applications, especially when combined with simultaneous nanoprobe spectroscopy.

  5. In situ observation of surface structures of cardiovascular endothelial cells with atomic force microscope

    Institute of Scientific and Technical Information of China (English)

    Tong Yin; Jin Luo; YaMin Ma; Xiao-Long Ji; Yu-Sheng Zhao; Shi-Wen Wang

    2009-01-01

    Objective To observe the surface structures of cardiovascular endothelial cells in situ with atomic force microscope (AFM). Methods Fresh aorta and aortic valve were dissected from 10 healthy male New Zealand white rabbits. Before fixed in 1% formaldehyde, the fresh tissues were washed in the buffer phosphate solution. Under general microscope, the fixed aorta or valve was spread on the double side stick tape which had already been stuck on the glass slide. The intima of aorta or the aorta side of valve was towards upside. Then the specimen was dried under 37 degrees centigrade in an attemperator and was washed with pure water. After dried again, the specimen was loaded on the platform ofNanoScope llla AFM and was scanned in tapping mode with the scanning speed of 0.5 HZ. Results The surface structures of endothelial cell on the fixed and dried tissue could be obsserved clearly in situ with AFM. Aortic endothclial cells were large, branched and arranged sparsely and parallel to the direction of blood flow, whereas endothelial cells on aorta valve surface were small, less branched and arranged intensively and vertical to the direction of blood flow. When the scanning range was dwindled, granular ultra-structures could be observed on the surface of endothelial cells, and, as the scanning range was dwindled further, fissure and convolution could be seen on the surface of granules from aortic endothelial cells. Centre cavity and surrounding swelling volcano-like structure could be seen on the surface of granules from endothelial cells of aortic valve. Conclusions It's feasible to observe the surface ultra-structures of cardiovascular endothelial cells in situ with AFM and morphological information provided by A FM might be of clinical value in future histopathological diagnosis.

  6. A miniaturized, high frequency mechanical scanner for high speed atomic force microscope using suspension on dynamically determined points

    NARCIS (Netherlands)

    Herfst, R.W.; Dekker, A.; Witvoet, G.; Crowcombe, W.E.; Lange, T.J. de; Sadeghian Marnani, H.

    2015-01-01

    One of the major limitations in the speed of the atomic force microscope (AFM) is the bandwidth of the mechanical scanning stage, especially in the vertical (z) direction. According to the design principles of “light and stiff” and “static determinacy,” the bandwidth of the mechanical scanner is

  7. A miniaturized, high frequency mechanical scanner for high speed atomic force microscope using suspension on dynamically determined points

    NARCIS (Netherlands)

    Herfst, R.W.; Dekker, A.; Witvoet, G.; Crowcombe, W.E.; Lange, T.J. de; Sadeghian Marnani, H.

    2015-01-01

    One of the major limitations in the speed of the atomic force microscope (AFM) is the bandwidth of the mechanical scanning stage, especially in the vertical (z) direction. According to the design principles of “light and stiff” and “static determinacy,” the bandwidth of the mechanical scanner is lim

  8. Position-resolved Surface Characterization and Nanofabrication Using an Optical Microscop e Combined with a Nanopip ette/Quartz Tuning Fork Atomic Force Microscop e

    Institute of Scientific and Technical Information of China (English)

    Sangmin An; Baekman Sung; Haneol Noh; Corey Stambaugh; Soyoung Kwon; Kunyoung Lee; Bongsu Kim; Qhwan Kim; Wonho Jhe

    2014-01-01

    In this work, we introduce position-resolved surface characterization and nanofabrication us-ing an optical microscope (OM) combined with a nanopipette-based quartz tuning fork atomic force micro-scope (nanopipette/QTF-AFM) system. This system is used to accurately determine substrate position and nanoscale phenomena under ambient conditions. Solutions consisting of 5 nm Au nanoparticles, nanowires, and polydimethylsiloxane (PDMS) are deposited onto the substrate through the nano/microaperture of a pulled pipette. Nano/microscale patterning is performed using a nanopipette/QTF-AFM, while position is resolved by monitoring the substrate with a custom OM. With this tool, one can perform surface characterization (force spectroscopy/microscopy) using the quartz tuning fork (QTF) sensor. Nanofabrication is achieved by accu-rately positioning target materials on the surface, and on-demand delivery and patterning of various solutions for molecular architecture.

  9. Novel parallel plate condenser for single particle electrostatic force measurements in atomic force microscope

    KAUST Repository

    Kwek, Jin Wang

    2011-07-01

    A combination of small parallel plate condenser with Indium Tin Oxide (ITO) glass slides as electrodes and an atomic force microscope (AFM) is used to characterize the electrostatic behavior of single glass bead microparticles (105-150 μm) glued to the AFM cantilever. This novel setup allows measurements of the electrostatic forces acting on a particle in an applied electrical field to be performed in ambient air conditions. By varying the position of the microparticle between the electrodes and the strength of the applied electric field, the relative contributions of the particle net charge, induced and image charges were investigated. When the microparticle is positioned in the middle of the electrodes, the force acting on the microparticle was linear with the applied electric field and proportional to the microparticle net charge. At distances close to the bottom electrode, the force follows a parabolic relationship with the applied electric field reflecting the contributions of induced and image charges. The method can be used for the rapid evaluation of the charging and polarizability properties of the microparticle as well as an alternative to the conventional Faraday\\'s pail technique. © 2011 Elsevier B.V.

  10. Determination of the Elastic Properties of Tomato Fruit Cells with an Atomic Force Microscope

    Directory of Open Access Journals (Sweden)

    Andrzej Kurenda

    2013-09-01

    Full Text Available Since the mechanical properties of single cells together with the intercellular adhesive properties determine the macro-mechanical properties of plants, a method for evaluation of the cell elastic properties is needed to help explanation of the behavior of fruits and vegetables in handling and food processing. For this purpose, indentation of tomato mesocarp cells with an atomic force microscope was used. The Young’s modulus of a cell using the Hertz and Sneddon models, and stiffness were calculated from force-indentation curves. Use of two probes of distinct radius of curvature (20 nm and 10,000 nm showed that the measured elastic properties were significantly affected by tip geometry. The Young’s modulus was about 100 kPa ± 35 kPa and 20 kPa ± 14 kPa for the sharper tip and a bead tip, respectively. Moreover, large variability regarding elastic properties (>100% among cells sampled from the same region in the fruit was observed. We showed that AFM provides the possibility of combining nano-mechanical properties with topography imaging, which could be very useful for the study of structure-related properties of fruits and vegetables at the cellular and sub-cellular scale.

  11. Nanoimaging and ultra structure of Entamoeba histolytica and its pseudopods by using atomic force microscope

    Science.gov (United States)

    Joshi, Narahari V.; Medina, Honorio; Urdaneta, H.; Barboza, J.

    2000-04-01

    Nan-imaging of Entamoeba histolytica was carried out by using Atomic Force Microscope (AFM). The structure of the nucleus, endoplasm and ectoplasm were studied separately. The diameter of the nucleus in living E. histolytica was found to be of the order of 10 micrometers which is slightly higher than the earlier reported value. The presence of karysome was detected in the nucleus. Well-organized patterns of chromatoid bodies located within the endoplasm, were detected and their repetitive patterns were examined. The organized structure was also extended within the ectoplasm. The dimensions and form of the organization suggest that chromatic bodies are constituted with ribosomes ordered in the form of folded sheet. Such structures were found to be absent in non-living E. histolytica. AFM images were also captured just in the act when ameba was extending its pseudopods. Alteration in the ultrastructure caused during the process of extension was viewed. Well marked canals of width 694.05 nm. And height 211.05 nm are clearly perceptible towards the direction of the pseudopods. 3D images are presented to appreciate the height variation, which can not be achieved by conventional well-established techniques such as electron microscopy.

  12. Imaging and analyzing the elasticity of vascular smooth muscle cells by atomic force acoustic microscope.

    Science.gov (United States)

    Zhang, Bo; Cheng, Qian; Chen, Ming; Yao, Wengang; Qian, Menglu; Hu, Bing

    2012-08-01

    Vascular smooth muscle cells (VSMCs) play an important role in the good performance of the vasculature. To study the surface, intracellular structure and elasticity of VSMCs, atomic force acoustic microscope (AFAM) was used for imaging VSMCs from A7r5 rat aorta arteries. The topography images of VSMCs were obtained in contact mode and the acoustic images were obtained by AFAM in sample vibration mode. Then, the force curve measurement derived using Young's modulus of the interested areas was used for evaluating elasticity properties. The acoustic images were found in higher resolution with more information than the topography images. The force curves showed the difference in Young's modulus of the different parts of VSMC. These findings demonstrate that AFAM is useful for displaying the surface, structure and elasticity property of VSMCs clearly, with short scanning time, negligible harm or damage to cell and nanometer-level resolution. Copyright © 2012 World Federation for Ultrasound in Medicine & Biology. Published by Elsevier Inc. All rights reserved.

  13. Atomic force microscopic study on topological structures of pBR322 DNA

    Institute of Scientific and Technical Information of China (English)

    张平城; 白春礼; 成英俊; 方晔; 王中怀; 黄熙泰

    1996-01-01

    Plasmid pBR322 DNA (0.5mg/mL) isolated from Escherichia coli HB101 was suspended in Tris-HCl-EDTA (1 mol/L - 0.1 mol/L, pH8.5); then a drop of the above solution was deposited on freshly cleaved mica substrate. After adsorption for about 1 min, the sample was stained with phosphotungstic acid. The residua] solution was removed with a piece of filter paper. Afterwards the sample was imaged with a home-made atomic force microscope (AFM) in air. The AFM images of pBR322 DNA with a molecular resolution have been obtained. These images show that pBR322 DNA exists in several different topological structures: (i) relaxed circular DNA with a different diameter; (ii) supercondensed DNA with different particle sizes; (iii) dimeric catenane connected by one relaxed circular molecule and another dose-compacted molecule which might be either supercoiled or intramolecular knotted form; (iv) oligomeric catenane with multiple irregular molecules in which DNA is interlocked into a complex oligomer; (v) possibly-existing

  14. In Situ Roughness Measurements for the Solar Cell Industry Using an Atomic Force Microscope

    Directory of Open Access Journals (Sweden)

    Higinio González-Jorge

    2010-04-01

    Full Text Available Areal roughness parameters always need to be under control in the thin film solar cell industry because of their close relationship with the electrical efficiency of the cells. In this work, these parameters are evaluated for measurements carried out in a typical fabrication area for this industry. Measurements are made using a portable atomic force microscope on the CNC diamond cutting machine where an initial sample of transparent conductive oxide is cut into four pieces. The method is validated by making a comparison between the parameters obtained in this process and in the laboratory under optimal conditions. Areal roughness parameters and Fourier Spectral Analysis of the data show good compatibility and open the possibility to use this type of measurement instrument to perform in situ quality control. This procedure gives a sample for evaluation without destroying any of the transparent conductive oxide; in this way 100% of the production can be tested, so improving the measurement time and rate of production.

  15. Combination of Universal Mechanical Testing Machine with Atomic Force Microscope for Materials Research

    Science.gov (United States)

    Zhong, Jian; He, Dannong

    2015-08-01

    Surface deformation and fracture processes of materials under external force are important for understanding and developing materials. Here, a combined horizontal universal mechanical testing machine (HUMTM)-atomic force microscope (AFM) system is developed by modifying UMTM to combine with AFM and designing a height-adjustable stabilizing apparatus. Then the combined HUMTM-AFM system is evaluated. Finally, as initial demonstrations, it is applied to analyze the relationship among macroscopic mechanical properties, surface nanomorphological changes under external force, and fracture processes of two kinds of representative large scale thin film materials: polymer material with high strain rate (Parafilm) and metal material with low strain rate (aluminum foil). All the results demonstrate the combined HUMTM-AFM system overcomes several disadvantages of current AFM-combined tensile/compression devices including small load force, incapability for large scale specimens, disability for materials with high strain rate, and etc. Therefore, the combined HUMTM-AFM system is a promising tool for materials research in the future.

  16. Fabrication and measurement of nanostructures on the micro ball surface using a modified atomic force microscope

    Science.gov (United States)

    Zhao, X. S.; Geng, Y. Q.; Li, W. B.; Yan, Y. D.; Hu, Z. J.; Sun, T.; Liang, Y. C.; Dong, S.

    2012-11-01

    In order to machine and measure nanostructures on the micro ball surface, a modified atomic force microscope (AFM) combining a commercial AFM system with a home built precision air bearing spindle is established. Based on this system, motions of both the AFM scanner and the air bearing spindle are controlled to machine nanostructures on the micro ball based on the AFM tip-based nano mechanical machining approach. The eccentric error between the axis of the micro ball and the axis of the spindle is reduced to 3-4 μm by the provided fine adjusting method. A 1000 nano lines array, 36 square pits structure, 10 square pits structure, and a zig-zag structure on the circumference of the micro ball with the diameter of 1.5 mm are machined successfully. The measurement results achieved by the same system reveal that the profiles and mode-power spectra curves of the micro ball are influenced by the artificially machined nanostructures significantly according to their distributions. This work is an useful attempt for modifying the micro ball profile and manufacture of the spherical modulation targets to study the experimental performance of the micro ball in implosion.

  17. The Asymmetrical Structure of Golgi Apparatus Membranes Revealed by In situ Atomic Force Microscope

    Science.gov (United States)

    Xu, Haijiao; Su, Weiheng; Cai, Mingjun; Jiang, Junguang; Zeng, Xianlu; Wang, Hongda

    2013-01-01

    The Golgi apparatus has attracted intense attentions due to its fascinating morphology and vital role as the pivot of cellular secretory pathway since its discovery. However, its complex structure at the molecular level remains elusive due to limited approaches. In this study, the structure of Golgi apparatus, including the Golgi stack, cisternal structure, relevant tubules and vesicles, were directly visualized by high-resolution atomic force microscope. We imaged both sides of Golgi apparatus membranes and revealed that the outer leaflet of Golgi membranes is relatively smooth while the inner membrane leaflet is rough and covered by dense proteins. With the treatment of methyl-β-cyclodextrin and Triton X-100, we confirmed the existence of lipid rafts in Golgi apparatus membrane, which are mostly in the size of 20 nm –200 nm and appear irregular in shape. Our results may be of significance to reveal the structure-function relationship of the Golgi complex and pave the way for visualizing the endomembrane system in mammalian cells at the molecular level. PMID:23613878

  18. Detection of erythrocytes influenced by aging and type 2 diabetes using atomic force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Jin, Hua; Xing, Xiaobo [Chemistry Department, Jinan University, Guangzhou 510632 (China); Zhao, Hongxia [Chemistry Department, Jinan University, Guangzhou 510632 (China); Faculty of Chemical Engineering and Light Industry, Guangdong University of Technology, Guangzhou 510090 (China); Chen, Yong [Institute for Advanced Study, Nanchang University, Nanchang, Jiangxi 330031 (China); Huang, Xun [Chemistry Department, Jinan University, Guangzhou 510632 (China); Ma, Shuyuan [Chemistry Department, Jinan University, Guangzhou 510632 (China); The First Affiliated Hospital, Jinan University, Guangzhou 510632 (China); Ye, Hongyan [Chemistry Department, Jinan University, Guangzhou 510632 (China); Cai, Jiye, E-mail: tjycai@jnu.edu.cn [Chemistry Department, Jinan University, Guangzhou 510632 (China)

    2010-01-22

    The pathophysiological changes of erythrocytes are detected at the molecular scale, which is important to reveal the onset of diseases. Type 2 diabetes is an age-related metabolic disorder with high prevalence in elderly (or old) people. Up to now, there are no treatments to cure diabetes. Therefore, early detection and the ability to monitor the progression of type 2 diabetes are very important for developing effective therapies. Type 2 diabetes is associated with high blood glucose in the context of insulin resistance and relative insulin deficiency. These abnormalities may disturb the architecture and functions of erythrocytes at molecular scale. In this study, the aging- and diabetes-induced changes in morphological and biomechanical properties of erythrocytes are clearly characterized at nanometer scale using atomic force microscope (AFM). The structural information and mechanical properties of the cell surface membranes of erythrocytes are very important indicators for determining the healthy, diseased or aging status. So, AFM may potentially be developed into a powerful tool in diagnosing diseases.

  19. Lipid memberane:inelastic deformation of surface structure by an atomic force microscope

    Institute of Scientific and Technical Information of China (English)

    2002-01-01

    The stability of the 1,2-Dioleoyl-sn-Glycero-3-[phospho-rac-1-Glycerol-Na] liposome in the liquid crystalline state have been investigated using an atomic force microscope(AFM),We have observed the inelastic deformation of the sample surface,The AFM tip causes persistent deformation of the surface of the lipid membrane,in which some of the lipid molecules are eventually pushed or dragged by the AFM tip.The experiment shows how the surface structure of the lipid membrane can be created by the interaction between the AFM tip and lipid membrane.When the operating force exceeds 10-8N,it leads to large deformations of the surface.A squareregion of about 1×1um2 is created by the scanning probe on the surface,When the operating force is between 10-11N and 10-8N,it can image the topography of the surface of the lipid membrane.The stability of the sample is related to the concentration of the medium in which the sample is prepared.

  20. Lipid membrane: inelastic deformation of surface structure by an atomic force microscope

    Institute of Scientific and Technical Information of China (English)

    张静; 孙润广

    2002-01-01

    The stability of the 1,2-Dioleoyl-sn-Glycero-3-[phospho-rac-1-Glycerol-Na] liposome in the liquid crystalline statehave been investigated using an atomic force microscope (AFM). We have observed the inelastic deformation of thesample surface. The AFM tip causes persistent deformation of the surface of the lipid membrane, in which some of thelipid molecules are eventually pushed or dragged by the AFM tip. The experiment shows how the surface structure ofthe lipid membrane can be created by the interaction between the AFM tip and lipid membrane. When the operatingforce exceeds 10-8 N, it leads to large deformations of the surface. A square region of about 1×1μm2 is created by thescanning probe on the surface. When the operating force is between 10-11N and 10-8N, it can image the topographyof the surface of the lipid membrane. The stability of the sample is related to the concentration of the medium in whichthe sample is prepared.

  1. The asymmetrical structure of Golgi apparatus membranes revealed by in situ atomic force microscope.

    Science.gov (United States)

    Xu, Haijiao; Su, Weiheng; Cai, Mingjun; Jiang, Junguang; Zeng, Xianlu; Wang, Hongda

    2013-01-01

    The Golgi apparatus has attracted intense attentions due to its fascinating morphology and vital role as the pivot of cellular secretory pathway since its discovery. However, its complex structure at the molecular level remains elusive due to limited approaches. In this study, the structure of Golgi apparatus, including the Golgi stack, cisternal structure, relevant tubules and vesicles, were directly visualized by high-resolution atomic force microscope. We imaged both sides of Golgi apparatus membranes and revealed that the outer leaflet of Golgi membranes is relatively smooth while the inner membrane leaflet is rough and covered by dense proteins. With the treatment of methyl-β-cyclodextrin and Triton X-100, we confirmed the existence of lipid rafts in Golgi apparatus membrane, which are mostly in the size of 20 nm -200 nm and appear irregular in shape. Our results may be of significance to reveal the structure-function relationship of the Golgi complex and pave the way for visualizing the endomembrane system in mammalian cells at the molecular level.

  2. The asymmetrical structure of Golgi apparatus membranes revealed by in situ atomic force microscope.

    Directory of Open Access Journals (Sweden)

    Haijiao Xu

    Full Text Available The Golgi apparatus has attracted intense attentions due to its fascinating morphology and vital role as the pivot of cellular secretory pathway since its discovery. However, its complex structure at the molecular level remains elusive due to limited approaches. In this study, the structure of Golgi apparatus, including the Golgi stack, cisternal structure, relevant tubules and vesicles, were directly visualized by high-resolution atomic force microscope. We imaged both sides of Golgi apparatus membranes and revealed that the outer leaflet of Golgi membranes is relatively smooth while the inner membrane leaflet is rough and covered by dense proteins. With the treatment of methyl-β-cyclodextrin and Triton X-100, we confirmed the existence of lipid rafts in Golgi apparatus membrane, which are mostly in the size of 20 nm -200 nm and appear irregular in shape. Our results may be of significance to reveal the structure-function relationship of the Golgi complex and pave the way for visualizing the endomembrane system in mammalian cells at the molecular level.

  3. Characterization of the photocurrents generated by the laser of atomic force microscopes

    Energy Technology Data Exchange (ETDEWEB)

    Ji, Yanfeng; Hui, Fei; Shi, Yuanyuan; Lanza, Mario, E-mail: mlanza@suda.edu.cn [Institute of Functional Nano and Soft Materials (FUNSOM), Collaborative Innovation Center of Suzhou Nanoscience and Technology, Soochow University, 199 Ren-Ai Road, Suzhou 215123 (China); Iglesias, Vanessa [International Iberian Nanotechnology Laboratory, 4715-330 Braga (Portugal); Lewis, David [Nanonics Imaging, Har Hotzvim, Jerusalem 91487 (Israel); Niu, Jiebin; Long, Shibing; Liu, Ming [Laboratory of Nanofabrication and Novel Device Integration, Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029 (China); Hofer, Alexander; Frammelsberger, Werner; Benstetter, Guenther [Deggendorf Institute of Technology, Edlmairstr. 6+8, 94469 Deggendorf (Germany); Scheuermann, Andrew; McIntyre, Paul C. [Department of Materials Science and Engineering, Stanford University, Stanford, California 94305 (United States)

    2016-08-15

    The conductive atomic force microscope (CAFM) has become an essential tool for the nanoscale electronic characterization of many materials and devices. When studying photoactive samples, the laser used by the CAFM to detect the deflection of the cantilever can generate photocurrents that perturb the current signals collected, leading to unreliable characterization. In metal-coated semiconductor samples, this problem is further aggravated, and large currents above the nanometer range can be observed even without the application of any bias. Here we present the first characterization of the photocurrents introduced by the laser of the CAFM, and we quantify the amount of light arriving to the surface of the sample. The mechanisms for current collection when placing the CAFM tip on metal-coated photoactive samples are also analyzed in-depth. Finally, we successfully avoided the laser-induced perturbations using a two pass technique: the first scan collects the topography (laser ON) and the second collects the current (laser OFF). We also demonstrate that CAFMs without a laser (using a tuning fork for detecting the deflection of the tip) do not have this problem.

  4. Direct observation of phase transition of GeSbTe thin films by Atomic Force Microscope

    Science.gov (United States)

    Yang, Fei; Xu, Ling; Zhang, Rui; Geng, Lei; Tong, Liang; Xu, Jun; Su, Weining; Yu, Yao; Ma, Zhongyuan; Chen, Kunji

    2012-10-01

    GeSbTe (GST) thin films were deposited on quartz substrates using electron beam evaporation system and then annealed in nitrogen atmosphere at different temperatures, ranging from 20 °C to 300 °C. X-ray diffraction (XRD) and Atomic Force microscope (AFM) measurements were used to characterize the as-deposited and post-annealed thin films. Annealing treatment was found to induce changes on microstructure, surface roughness and grain size, indicating that with the increase of annealing temperature, the amorphous GST films first changed to face-centered-cubic (fcc) phase and then the stable hexagonal (hex) phase. Meanwhile, conductive-AFM (C-AFM) was used to produce crystallized GST dots on thin films. I-V spectroscopy results show that GST films can switch from amorphous state to crystalline state at threshold voltage. After switching, I-V curve exhibits ohmic characteristic, which is usually observed in crystallized GST films. By applying repeated I-V spectroscopies on the thin films, crystallized nuclei were observed. As the times of I-V spectroscopies increases, the area of written dots increases, and the center of the mark begin to ablate. The AFM images show that the shape of marks is an ablated center with a raised ring surrounding it.

  5. An analytic model for accurate spring constant calibration of rectangular atomic force microscope cantilevers.

    Science.gov (United States)

    Li, Rui; Ye, Hongfei; Zhang, Weisheng; Ma, Guojun; Su, Yewang

    2015-10-29

    Spring constant calibration of the atomic force microscope (AFM) cantilever is of fundamental importance for quantifying the force between the AFM cantilever tip and the sample. The calibration within the framework of thin plate theory undoubtedly has a higher accuracy and broader scope than that within the well-established beam theory. However, thin plate theory-based accurate analytic determination of the constant has been perceived as an extremely difficult issue. In this paper, we implement the thin plate theory-based analytic modeling for the static behavior of rectangular AFM cantilevers, which reveals that the three-dimensional effect and Poisson effect play important roles in accurate determination of the spring constants. A quantitative scaling law is found that the normalized spring constant depends only on the Poisson's ratio, normalized dimension and normalized load coordinate. Both the literature and our refined finite element model validate the present results. The developed model is expected to serve as the benchmark for accurate calibration of rectangular AFM cantilevers.

  6. Characterization of the photocurrents generated by the laser of atomic force microscopes.

    Science.gov (United States)

    Ji, Yanfeng; Hui, Fei; Shi, Yuanyuan; Iglesias, Vanessa; Lewis, David; Niu, Jiebin; Long, Shibing; Liu, Ming; Hofer, Alexander; Frammelsberger, Werner; Benstetter, Guenther; Scheuermann, Andrew; McIntyre, Paul C; Lanza, Mario

    2016-08-01

    The conductive atomic force microscope (CAFM) has become an essential tool for the nanoscale electronic characterization of many materials and devices. When studying photoactive samples, the laser used by the CAFM to detect the deflection of the cantilever can generate photocurrents that perturb the current signals collected, leading to unreliable characterization. In metal-coated semiconductor samples, this problem is further aggravated, and large currents above the nanometer range can be observed even without the application of any bias. Here we present the first characterization of the photocurrents introduced by the laser of the CAFM, and we quantify the amount of light arriving to the surface of the sample. The mechanisms for current collection when placing the CAFM tip on metal-coated photoactive samples are also analyzed in-depth. Finally, we successfully avoided the laser-induced perturbations using a two pass technique: the first scan collects the topography (laser ON) and the second collects the current (laser OFF). We also demonstrate that CAFMs without a laser (using a tuning fork for detecting the deflection of the tip) do not have this problem.

  7. Atomic Force Microscope Imaging of the Aggregation of Mouse Immunoglobulin G Molecules

    Directory of Open Access Journals (Sweden)

    Ke Xia

    2003-01-01

    Full Text Available Mouse immunoglobulin G (Ig G1 and the mixture of Ig G1 and Ig G2 deposited on mica were imaged with an atomic force microscope at room temperature and ambient pressure. At a concentration around 1.0mg/L, the molecules were well dispersed. 2~3 days after sample preparation, both Ig G1 and the mixture could self- assemble into different shapes and further form some types of local-ordered toroidal aggregations (monotoroidal, intercrossed toroidal, concentric toroidal, etc.. The number of monomers was not identical in the different toroidal aggregations but in a same circle, the shapes of polymer self-assembled by several monomolecules were found to be almost the same. There was difference between the aggregation behavior of Ig G1 and the mixture. The mechanism of Ig G molecule aggregation was ascribed to the “Y” shape and loops structure of Ig G molecule.

  8. AN INTELLIGENT NEURO-FUZZY TERMINAL SLIDING MODE CONTROL METHOD WITH APPLICATION TO ATOMIC FORCE MICROSCOPE

    Directory of Open Access Journals (Sweden)

    Seied Yasser Nikoo

    2016-11-01

    Full Text Available In this paper, a neuro-fuzzy fast terminal sliding mode control method is proposed for controlling a class of nonlinear systems with bounded uncertainties and disturbances. In this method, a nonlinear terminal sliding surface is firstly designed. Then, this sliding surface is considered as input for an adaptive neuro-fuzzy inference system which is the main controller. A proportinal-integral-derivative controller is also used to asist the neuro-fuzzy controller in order to improve the performance of the system at the begining stage of control operation. In addition, bee algorithm is used in this paper to update the weights of neuro-fuzzy system as well as the parameters of the proportinal-integral-derivative controller. The proposed control scheme is simulated for vibration control in a model of atomic force microscope system and the results are compared with conventional sliding mode controllers. The simulation results show that the chattering effect in the proposed controller is decreased in comparison with the sliding mode and the terminal sliding mode controllers. Also, the method provides the advantages of fast convergence and low model dependency compared to the conventional methods.

  9. Microdrops on atomic force microscope cantilevers: evaporation of water and spring constant calibration.

    Science.gov (United States)

    Bonaccurso, Elmar; Butt, Hans-Jürgen

    2005-01-13

    The evaporation of water drops with radii approximately 20 microm was investigated experimentally by depositing them onto atomic force microscope (AFM) cantilevers and measuring the deflection versus time. Because of the surface tension of the liquid, the Laplace pressure inside the drop, and the change of interfacial stress at the solid-liquid interface, the cantilever is deflected by typically a few hundred nanometers. The experimental results are in accordance with an analytic theory developed. The evaporation process could be monitored with high accuracy even at the last stage of evaporation because (1) cantilever deflections can be measured with nanometer resolution and (2) the time resolution, given by the inverse of the resonance frequency of the cantilever of approximately 0.3 ms, is much faster than the typical evaporation time of 1 s. Experimental results indicate that evaporation of the last thin layer of water is significantly slower than the rest of the drop, which can be due to surface forces. This drop-on-cantilever system can also be used to analyze the drop impact dynamics on a surface and to determine the spring constant of cantilevers.

  10. The study of nanoscratch and nanomachining on hard multilayer thin films using atomic force microscope.

    Science.gov (United States)

    Huang, Jen-Ching; Li, Chia-Lin; Lee, Jyh-Wei

    2012-01-01

    In this study, nanoscratching and nanomachining were conducted using an atomic force microscope (AFM) equipped with a doped diamond-coated probe (DDESP-10; VEECO) to evaluate the fabrication of nanopatterns on hard, Cr₂N/Cu multilayer thin films. The influence of normal force, scratch speed, and repeated scratches on the properties of hard multilayer thin films was also investigated. The nanoscratch experiments led researchers to establish a probe preparation and selection criteria (PPS criteria) to enhance the stability and accuracy of machining hard materials. Experimental results indicate that the depth of grooves produced by nanoscratching increased with an increase in normal force, while an increase in the number of scratches in a single location increased the groove depth but decreased friction. Therelationships among normal force and groove depth more closely resembled a logarithmic form than other mathematical models, as did the relationship between repeated scratching and its effect on groove depth and friction. The influence of scratch speed on friction was divided into two ranges. Between 0.1 and 2 µm/s, friction decreased logarithmically with an increase in scratch speed; however, when the speed exceeded 2 µm/s, the friction appeared stable. In this study, multilayered coatings were successfully machined, demonstrating considerable promise for the fabrication of nanopatterns in multilayered coatings at the nanoscale.

  11. Atomic force microscopic observation on substructure of pollen exine in Cedrus deodara and Metasequoia glyptostroboides

    Institute of Scientific and Technical Information of China (English)

    2000-01-01

    The substructure of pollen exine in Cedrus deodara (Roxb.) Loud. and Metasequoia glyptostroboides Hu et Cheng has been examined with an atomic force microscope (AFM). The results indicate that the exine substructure units containing sporopollenin in two species are similar in shape, which are granular, but slightly different in size. In Cedrus the substructure unit of pollen exine appears to be 56-99 nm long and 42-74 nm wide, while in Metasequoia it appears to be 81-118 nm long and 43-98 nm wide. It has been observed that the subunits of pollen exine in Cedrus arranged tightly to form short-rod-like or spheroidal pollen exine units, several or more than ten of which formed an island-like structure. There are various spaces among these island-like structures which are interconnected to occupy the entire pollen exine. In Metasequoia, the subunits of pollen exine also arranged tightly with a distribution tendency of cluster of 3-10, however, no obvious boundary exists among these clusters. From our results, it is concluded that there is no tendency of helical arrangement for the subunits of pollen exine in Cedrus and Metasequoia, and the results support Southworth' view that subunits of pollen exine are granular shape in lattice structure.

  12. Fabrication of large scale nanostructures based on a modified atomic force microscope nanomechanical machining system.

    Science.gov (United States)

    Hu, Z J; Yan, Y D; Zhao, X S; Gao, D W; Wei, Y Y; Wang, J H

    2011-12-01

    The atomic force microscope (AFM) tip-based nanomechanical machining has been demonstrated to be a powerful tool for fabricating complex 2D∕3D nanostructures. But the machining scale is very small, which holds back this technique severely. How to enlarge the machining scale is always a major concern for the researches. In the present study, a modified AFM tip-based nanomechanical machining system is established through combination of a high precision X-Y stage with the moving range of 100 mm × 100 mm and a commercial AFM in order to enlarge the machining scale. It is found that the tracing property of the AFM system is feasible for large scale machining by controlling the constant normal load. Effects of the machining parameters including the machining direction and the tip geometry on the uniform machined depth with a large scale are evaluated. Consequently, a new tip trace and an increasing load scheme are presented to achieve a uniform machined depth. Finally, a polymer nanoline array with the dimensions of 1 mm × 0.7 mm, the line density of 1000 lines/mm and the average machined depth of 150 nm, and a 20 × 20 polymer square holes array with the scale of 380 μm × 380 μm and the average machined depth of 250 nm are machined successfully. The uniform of the machined depths for all the nanostructures is acceptable. Therefore, it is verified that the AFM tip-based nanomechanical machining method can be used to machine millimeter scale nanostructures.

  13. Evaluation of carbon nanotube probes in critical dimension atomic force microscopes.

    Science.gov (United States)

    Choi, Jinho; Park, Byong Chon; Ahn, Sang Jung; Kim, Dal-Hyun; Lyou, Joon; Dixson, Ronald G; Orji, Ndubuisi G; Fu, Joseph; Vorburger, Theodore V

    2016-07-01

    The decreasing size of semiconductor features and the increasing structural complexity of advanced devices have placed continuously greater demands on manufacturing metrology, arising both from the measurement challenges of smaller feature sizes and the growing requirement to characterize structures in more than just a single critical dimension. For scanning electron microscopy, this has resulted in increasing sophistication of imaging models. For critical dimension atomic force microscopes (CD-AFMs), this has resulted in the need for smaller and more complex tips. Carbon nanotube (CNT) tips have thus been the focus of much interest and effort by a number of researchers. However, there have been significant issues surrounding both the manufacture and use of CNT tips. Specifically, the growth or attachment of CNTs to AFM cantilevers has been a challenge to the fabrication of CNT tips, and the flexibility and resultant bending artifacts have presented challenges to using CNT tips. The Korea Research Institute for Standards and Science (KRISS) has invested considerable effort in the controlled fabrication of CNT tips and is collaborating with the National Institute of Standards and Technology on the application of CNT tips for CD-AFM. Progress by KRISS on the precise control of CNT orientation, length, and end modification, using manipulation and focused ion beam processes, has allowed us to implement ball-capped CNT tips and bent CNT tips for CD-AFM. Using two different generations of CD-AFM instruments, we have evaluated these tip types by imaging a line/space grating and a programmed line edge roughness specimen. We concluded that these CNTs are capable of scanning the profiles of these structures, including re-entrant sidewalls, but there remain important challenges to address. These challenges include tighter control of tip geometry and careful optimization of scan parameters and algorithms for using CNT tips.

  14. Force measurements with the atomic force microscope: Technique, interpretation and applications

    Science.gov (United States)

    Butt, Hans-Jürgen; Cappella, Brunero; Kappl, Michael

    2005-10-01

    The atomic force microscope (AFM) is not only a tool to image the topography of solid surfaces at high resolution. It can also be used to measure force-versus-distance curves. Such curves, briefly called force curves, provide valuable information on local material properties such as elasticity, hardness, Hamaker constant, adhesion and surface charge densities. For this reason the measurement of force curves has become essential in different fields of research such as surface science, materials engineering, and biology. Another application is the analysis of surface forces per se. Some of the most fundamental questions in colloid and surface science can be addressed directly with the AFM: What are the interactions between particles in a liquid? How can a dispersion be stabilized? How do surfaces in general and particles in particular adhere to each other? Particles and surfaces interactions have major implications for friction and lubrication. Force measurements on single molecules involving the rupture of single chemical bonds and the stretching of polymer chains have almost become routine. The structure and properties of confined liquids can be addressed since force measurements provide information on the energy of a confined liquid film. After the review of Cappella [B. Cappella, G. Dietler, Surf. Sci. Rep. 34 (1999) 1-104] 6 years of intense development have occurred. In 1999, the AFM was used only by experts to do force measurements. Now, force curves are used by many AFM researchers to characterize materials and single molecules. The technique and our understanding of surface forces has reached a new level of maturity. In this review we describe the technique of AFM force measurements. Important experimental issues such as the determination of the spring constant and of the tip radius are discussed. Current state of the art in analyzing force curves obtained under different conditions is presented. Possibilities, perspectives but also open questions and

  15. Atomic force microscope adhesion measurements and atomistic molecular dynamics simulations at different humidities

    Science.gov (United States)

    Seppä, Jeremias; Reischl, Bernhard; Sairanen, Hannu; Korpelainen, Virpi; Husu, Hannu; Heinonen, Martti; Raiteri, Paolo; Rohl, Andrew L.; Nordlund, Kai; Lassila, Antti

    2017-03-01

    Due to their operation principle atomic force microscopes (AFMs) are sensitive to all factors affecting the detected force between the probe and the sample. Relative humidity is an important and often neglected—both in experiments and simulations—factor in the interaction force between AFM probe and sample in air. This paper describes the humidity control system designed and built for the interferometrically traceable metrology AFM (IT-MAFM) at VTT MIKES. The humidity control is based on circulating the air of the AFM enclosure via dryer and humidifier paths with adjustable flow and mixing ratio of dry and humid air. The design humidity range of the system is 20-60 %rh. Force-distance adhesion studies at humidity levels between 25 %rh and 53 %rh are presented and compared to an atomistic molecular dynamics (MD) simulation. The uncertainty level of the thermal noise method implementation used for force constant calibration of the AFM cantilevers is 10 %, being the dominant component of the interaction force measurement uncertainty. Comparing the simulation and the experiment, the primary uncertainties are related to the nominally 7 nm radius and shape of measurement probe apex, possible wear and contamination, and the atomistic simulation technique details. The interaction forces are of the same order of magnitude in simulation and measurement (5 nN). An elongation of a few nanometres of the water meniscus between probe tip and sample, before its rupture, is seen in simulation upon retraction of the tip in higher humidity. This behaviour is also supported by the presented experimental measurement data but the data is insufficient to conclusively verify the quantitative meniscus elongation.

  16. Set-up of a High-Resolution 300 mK Atomic Force Microscope in an Ultra-High Vacuum Compatible 3He/10T Cryostat

    CERN Document Server

    von Allwörden, Henning; Köhler, Arne; Eelbo, Thomas; Schwarz, Alexander; Wiesendanger, Roland

    2016-01-01

    The design of an atomic force microscope with an all-fiber interferometric detection scheme capable of atomic resolution at about 500 mK is presented. The microscope body is connected to a small pumped 3He reservoir with a base temperature of about 300 mK. The bakeable insert with the cooling stage can be moved from its measurement position inside the bore of a superconducting 10 T magnet into an ultra-high vacuum chamber, where tip and sample can be exchanged in-situ. Moreover, single atoms or molecules can be evaporated onto a cold substrate located inside the microscope. Two side chambers are equipped with standard surface preparation and surface analysis tools. The performance of the microscope at low temperatures is demonstrated by resolving single Co atoms on Mn/W(110) and by showing atomic resolution on NaCl(001).

  17. Set-up of a high-resolution 300 mK atomic force microscope in an ultra-high vacuum compatible 3He/10 T cryostat

    Science.gov (United States)

    von Allwörden, H.; Ruschmeier, K.; Köhler, A.; Eelbo, T.; Schwarz, A.; Wiesendanger, R.

    2016-07-01

    The design of an atomic force microscope with an all-fiber interferometric detection scheme capable of atomic resolution at about 500 mK is presented. The microscope body is connected to a small pumped 3He reservoir with a base temperature of about 300 mK. The bakeable insert with the cooling stage can be moved from its measurement position inside the bore of a superconducting 10 T magnet into an ultra-high vacuum chamber, where the tip and sample can be exchanged in situ. Moreover, single atoms or molecules can be evaporated onto a cold substrate located inside the microscope. Two side chambers are equipped with standard surface preparation and surface analysis tools. The performance of the microscope at low temperatures is demonstrated by resolving single Co atoms on Mn/W(110) and by showing atomic resolution on NaCl(001).

  18. Set-up of a high-resolution 300 mK atomic force microscope in an ultra-high vacuum compatible (3)He/10 T cryostat.

    Science.gov (United States)

    von Allwörden, H; Ruschmeier, K; Köhler, A; Eelbo, T; Schwarz, A; Wiesendanger, R

    2016-07-01

    The design of an atomic force microscope with an all-fiber interferometric detection scheme capable of atomic resolution at about 500 mK is presented. The microscope body is connected to a small pumped (3)He reservoir with a base temperature of about 300 mK. The bakeable insert with the cooling stage can be moved from its measurement position inside the bore of a superconducting 10 T magnet into an ultra-high vacuum chamber, where the tip and sample can be exchanged in situ. Moreover, single atoms or molecules can be evaporated onto a cold substrate located inside the microscope. Two side chambers are equipped with standard surface preparation and surface analysis tools. The performance of the microscope at low temperatures is demonstrated by resolving single Co atoms on Mn/W(110) and by showing atomic resolution on NaCl(001).

  19. Growth of InGaAs-capped InAs quantum dots characterized by Atomic Force Microscope and Scanning Electron Microscope

    Energy Technology Data Exchange (ETDEWEB)

    Chen Shende; Tsai Chiouyun; Lee Sichen [National Taiwan University, Department of Electrical Engineering, Graduate Institute of Electronics Engineering (China)

    2004-08-15

    Atomic force microscopy (AFM) is typically used to measure the quantum dot shape and density formed by lattice mismatched epitaxial growth such as InAs on GaAs. However, AFM images are distorted when two dots are situated in juxtaposition with a distance less than the AFM tip width. Scanning electron Microscope (SEM) is much better in distinguishing the dot density but not the dot height. Through these measurements of the growth of In{sub x}Ga{sub 1-x}As cap layer on InAs quantum dots, it was observed that the InGaAs layer neither covered the InAs quantum dots and wetting layer uniformly nor 100% phase separates into InAs and GaAs grown on InAs quantum dots and wetting layer, respectively.

  20. Design of a self-aligned, wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with 10 nm magnetic force microscope resolution

    Energy Technology Data Exchange (ETDEWEB)

    Karcı, Özgür [NanoMagnetics Instruments Ltd., Hacettepe - İvedik OSB Teknokent, 1368. Cad., No: 61/33, 06370, Yenimahalle, Ankara (Turkey); Department of Nanotechnology and Nanomedicine, Hacettepe University, Beytepe, 06800 Ankara (Turkey); Dede, Münir [NanoMagnetics Instruments Ltd., Hacettepe - İvedik OSB Teknokent, 1368. Cad., No: 61/33, 06370, Yenimahalle, Ankara (Turkey); Oral, Ahmet, E-mail: orahmet@metu.edu.tr [Department of Physics, Middle East Technical University, 06800 Ankara (Turkey)

    2014-10-01

    We describe the design of a wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with a self-aligned fibre-cantilever mechanism. An alignment chip with alignment groves and a special mechanical design are used to eliminate tedious and time consuming fibre-cantilever alignment procedure for the entire temperature range. A low noise, Michelson fibre interferometer was integrated into the system for measuring deflection of the cantilever. The spectral noise density of the system was measured to be ~12 fm/√Hz at 4.2 K at 3 mW incident optical power. Abrikosov vortices in BSCCO(2212) single crystal sample and a high density hard disk sample were imaged at 10 nm resolution to demonstrate the performance of the system.

  1. Influence of atomic kinetics in the simulation of plasma microscopic properties and thermal instabilities for radiative bow shock experiments

    Science.gov (United States)

    Espinosa, G.; Rodríguez, R.; Gil, J. M.; Suzuki-Vidal, F.; Lebedev, S. V.; Ciardi, A.; Rubiano, J. G.; Martel, P.

    2017-03-01

    Numerical simulations of laboratory astrophysics experiments on plasma flows require plasma microscopic properties that are obtained by means of an atomic kinetic model. This fact implies a careful choice of the most suitable model for the experiment under analysis. Otherwise, the calculations could lead to inaccurate results and inappropriate conclusions. First, a study of the validity of the local thermodynamic equilibrium in the calculation of the average ionization, mean radiative properties, and cooling times of argon plasmas in a range of plasma conditions of interest in laboratory astrophysics experiments on radiative shocks is performed in this work. In the second part, we have made an analysis of the influence of the atomic kinetic model used to calculate plasma microscopic properties of experiments carried out on magpie on radiative bow shocks propagating in argon. The models considered were developed assuming both local and nonlocal thermodynamic equilibrium and, for the latter situation, we have considered in the kinetic model different effects such as external radiation field and plasma mixture. The microscopic properties studied were the average ionization, the charge state distributions, the monochromatic opacities and emissivities, the Planck mean opacity, and the radiative power loss. The microscopic study was made as a postprocess of a radiative-hydrodynamic simulation of the experiment. We have also performed a theoretical analysis of the influence of these atomic kinetic models in the criteria for the onset possibility of thermal instabilities due to radiative cooling in those experiments in which small structures were experimentally observed in the bow shock that could be due to this kind of instability.

  2. Graphene-coated atomic force microscope tips for reliable nanoscale electrical characterization.

    Science.gov (United States)

    Lanza, M; Bayerl, A; Gao, T; Porti, M; Nafria, M; Jing, G Y; Zhang, Y F; Liu, Z F; Duan, H L

    2013-03-13

    Graphene single-layer films are grown by chemical vapor deposition and transferred onto commercially available conductive tips for atomic force microscopy. Graphene-coated tips are much more resistant to both high currents and frictions than commercially available, metal-varnished, conductive atomic force microscopy tips, leading to much larger lifetimes and more reliable imaging due to a lower tip-sample interaction.

  3. Determination of the elastic moduli of thin samples and adherent cells using conical atomic force microscope tips

    Science.gov (United States)

    Gavara, Núria; Chadwick, Richard S.

    2012-12-01

    The atomic force microscope can detect the mechanical fingerprints of normal and diseased cells at the single-cell level under physiological conditions. However, atomic force microscopy studies of cell mechanics are limited by the `bottom effect' artefact that arises from the stiff substrates used to culture cells. Because cells adhered to substrates are very thin, this artefact makes cells appear stiffer than they really are. Here, we show an analytical correction that accounts for this artefact when conical tips are used for atomic force microscope measurements of thin samples. Our bottom effect cone correction (BECC) corrects the Sneddon's model, which is widely used to measure Young's modulus, E. Comparing the performance of BECC and Sneddon's model on thin polyacrylamide gels, we find that although Sneddon's model overestimates E, BECC yields E values that are thickness-independent and similar to those obtained on thick regions of the gel. The application of BECC to measurements on live adherent fibroblasts demonstrates a significant improvement on the estimation of their local mechanical properties.

  4. In situ studies of the atomic layer deposition of thin HfO{sub 2} dielectrics by ultra high vacuum atomic force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Kolanek, Krzysztof, E-mail: kolanek@tu-cottbus.d [Brandenburg University of Technology, Department of Applied Physics and Sensors, Konrad-Wachsmann-Allee 17, 03046 Cottbus (Germany); Tallarida, Massimo; Karavaev, Konstantin; Schmeisser, Dieter [Brandenburg University of Technology, Department of Applied Physics and Sensors, Konrad-Wachsmann-Allee 17, 03046 Cottbus (Germany)

    2010-06-01

    We studied in situ the initial stages of atomic layer deposition (ALD) of HfO{sub 2} by an ultra high vacuum atomic force microscope working in frequency-modulation mode. The ALD cycles, made by using tetrakis-di-methyl-amido-Hf and water as precursors, were performed on the Si(001)/SiO{sub 2} substrate maintained at 230 {sup o}C. After each ALD cycle we studied the influence of the HfO{sub 2} growth on the surface height histogram, the root mean square roughness, the surface fractal dimension and the autocorrelation function. This detailed analysis of the surface topography allowed us to confirm the completion of the first HfO{sub 2} layer after four ALD cycles.

  5. Sub-poissonian loading of single atoms in a microscopic dipole trap.

    Science.gov (United States)

    Schlosser, N; Reymond, G; Protsenko, I; Grangier, P

    2001-06-28

    The ability to manipulate individual atoms, ions or photons allows controlled engineering of the quantum state of small sets of trapped particles; this is necessary to encode and process information at the quantum level. Recent achievements in this direction have used either trapped ions or trapped photons in cavity quantum-electrodynamical systems. A third possibility that has been studied theoretically is to use trapped neutral atoms. Such schemes would benefit greatly from the ability to trap and address individual atoms with high spatial resolution. Here we demonstrate a method for loading and detecting individual atoms in an optical dipole trap of submicrometre size. Because of the extremely small trapping volume, only one atom can be loaded at a time, so that the statistics of the number of atoms in the trap, N, are strongly sub-poissonian (DeltaN2 approximately 0.5N). We present a simple model for describing the observed behaviour, and we discuss the possibilities for trapping and addressing several atoms in separate traps, for applications in quantum information processing.

  6. Improving the electrical performance of a conductive atomic force microscope with a logarithmic current-to-voltage converter

    Science.gov (United States)

    Aguilera, L.; Lanza, M.; Porti, M.; Grifoll, J.; Nafría, M.; Aymerich, X.

    2008-07-01

    A new configuration of conductive atomic force microscope (CAFM) is presented, which is based in a standard CAFM where the typical I-V converter has been replaced by a logI-V amplifier. This substitution extends the current dynamic range from 1-100pAto1pA -1mA. With the broadening of the current dynamic range, the CAFM can access new applications, such as the reliability evaluation of metal-oxide-semiconductor gate dielectrics. As an example, the setup has been tested by analyzing breakdown spots induced in SiO2 layers.

  7. Preparation of La-Ti Composite Oxide Nanocrystal and Examination of Their Surface Topography with Atomic Force Microscope

    Institute of Scientific and Technical Information of China (English)

    2003-01-01

    With sol-gel method, nanometer La-Ti composite oxide was successfully prepared at a low temperature (750~800℃) using polyethylene glycol as dispersant. By means of atomic force microscope, the surface pattern, particle size distribution, and specific surface area were studied. The compound particle surface appears as a smooth sheet, the mean size of the compound is 25.38 nm. On the specific surface, the particle erects at a height of 4.69 nm. The surface area is 58.90 nm2. The La-Ti composite oxide nanocrystal prefers to narrow and even particle size distribution and the homogeneity of surface topography.

  8. Dual-cut graphene transistors with constant-current regions fabricated by the atomic force microscope anode oxidation

    Science.gov (United States)

    Wu, Chong-Rong; Dou, Kun Peng; Wang, Cheng-Hung; Chang, Chung-En; Kaun, Chao-Cheng; Wu, Chao-Hsin; Lin, Shih-Yen

    2017-01-01

    Graphene bandgap opening is an important issue for the application of this material. We have demonstrated that by atomic force microscope (AFM) anode oxidation, long nonconductive oxidation lines can be fabricated on graphene surfaces. By using this fabrication technique with the dual-cut transistor architecture, the phenomenon of constant-current regions near the Dirac point can be observed in devices at room temperature when the cut separation is smaller than 100 nm. The results may provide evidence of the phenomenon of graphene bandgap opening at room temperature. The theoretical bandgap values are further estimated by density-function-derived tight-binding calculations.

  9. A study of the morphology of photochromic and thermochromic MoO 3 amorphous films using an atomic force microscope

    Science.gov (United States)

    Chudnovskii, F. A.; Schaefer, D. M.; Gavrilyuk, A. I.; Reifenberger, R.

    The surface morphology of amorphous MoO 3 films enhanced by a coating of N.N-dimethylformamide was studied with an atomic force microscope. Images of the as-grown films revealed a surface structure consisting of ˜25 nm diameter clusters which had coalesced to form irregular-shaped grains with dimensions ranging between 100 and 190 nm. Similar structure was found in the films after a photochromic or thermochromic transition had occured. The relative surface areas of the films have been calculated and little change is observed after the photochromic transition while a ˜29 increase in surface area is observed after the thermochromic transition has taken place.

  10. Modification of a YBa2Cu3O7-δ Thin Film Using an Atomic Force Microscope

    Institute of Scientific and Technical Information of China (English)

    尤立星; 尹晓波; 冯一军; 杨森祖; 康琳; 王牧; 吴培亨

    2002-01-01

    A YBa2Cu3O7-δ thin film is modified by a probe electric field of an atomic force microscope to form a ridge with the width of only a grain cell. The modification varies with the operation parameters of the bias voltage,the moving velocity of the probe and the ambient humidity. Energy dispersive spectroscopy analysis shows only oxygen deficiency in the modified YBCO thin film. As a result, the suppressed superconductivity was found in the junction crossing the ridge.

  11. High-resolution nanomechanical analysis of suspended electrospun silk fibers with the torsional harmonic atomic force microscope

    Directory of Open Access Journals (Sweden)

    Mark Cronin-Golomb

    2013-04-01

    Full Text Available Atomic force microscopes have become indispensable tools for mechanical characterization of nanoscale and submicron structures. However, materials with complex geometries, such as electrospun fiber networks used for tissue scaffolds, still pose challenges due to the influence of tension and bending modulus on the response of the suspended structures. Here we report mechanical measurements on electrospun silk fibers with various treatments that allow discriminating among the different mechanisms that determine the mechanical behavior of these complex structures. In particular we were able to identify the role of tension and boundary conditions (pinned versus clamped in determining the mechanical response of electrospun silk fibers. Our findings show that high-resolution mechanical imaging with torsional harmonic atomic force microscopy provides a reliable method to investigate the mechanics of materials with complex geometries.

  12. Manipulation of adsorbed atoms and creation of new structures on room-temperature surfaces with a scanning tunneling microscope.

    Science.gov (United States)

    Whitman, L J; Stroscio, J A; Dragoset, R A; Celotta, R J

    1991-03-01

    A general method of manipulating adsorbed atoms and molecules on room-temperature surfaces with the use of a scanning tunneling microscope is described. By applying an appropriate voltage pulse between the sample and probe tip, adsorbed atoms can be induced to diffuse into the region beneath the tip. The field-induced diffusion occurs preferentially toward the tip during the voltage pulse because of the local potential energy gradient arising from the interaction of the adsorbate dipole moment with the electric field gradient at the surface. Depending upon the surface and pulse parameters, cesium (Cs) structures from one nanometer to a few tens of nanometers across have been created in this way on the (110) surfaces of gallium arsenide (GaAs) and indium antimonide (InSb), including structures that do not naturally occur.

  13. Nanoscale imaging of the growth and division of bacterial cells on planar substrates with the atomic force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Van Der Hofstadt, M. [Institut de Bioenginyeria de Catalunya (IBEC), C/ Baldiri i Reixac 11-15, 08028 Barcelona (Spain); Hüttener, M.; Juárez, A. [Institut de Bioenginyeria de Catalunya (IBEC), C/ Baldiri i Reixac 11-15, 08028 Barcelona (Spain); Departament de Microbiologia, Universitat de Barcelona, Avinguda Diagonal 645, 08028 Barcelona (Spain); Gomila, G., E-mail: ggomila@ibecbarcelona.eu [Institut de Bioenginyeria de Catalunya (IBEC), C/ Baldiri i Reixac 11-15, 08028 Barcelona (Spain); Departament d' Electronica, Universitat de Barcelona, C/ Marti i Franqués 1, 08028 Barcelona (Spain)

    2015-07-15

    With the use of the atomic force microscope (AFM), the Nanomicrobiology field has advanced drastically. Due to the complexity of imaging living bacterial processes in their natural growing environments, improvements have come to a standstill. Here we show the in situ nanoscale imaging of the growth and division of single bacterial cells on planar substrates with the atomic force microscope. To achieve this, we minimized the lateral shear forces responsible for the detachment of weakly adsorbed bacteria on planar substrates with the use of the so called dynamic jumping mode with very soft cantilever probes. With this approach, gentle imaging conditions can be maintained for long periods of time, enabling the continuous imaging of the bacterial cell growth and division, even on planar substrates. Present results offer the possibility to observe living processes of untrapped bacteria weakly attached to planar substrates. - Highlights: • Gelatine coatings used to weakly attach bacterial cells onto planar substrates. • Use of the dynamic jumping mode as a non-perturbing bacterial imaging mode. • Nanoscale resolution imaging of unperturbed single living bacterial cells. • Growth and division of single bacteria cells on planar substrates observed.

  14. Influence of measuring parameters on the accuracy of atomic force microscope in industrial applications

    DEFF Research Database (Denmark)

    Tosello, Guido; Antico, Andrea; Hansen, Hans Nørgaard;

    2009-01-01

    Atomic Force Microscopy (AFM) is a powerful technique providing 3D surface topographies with very high resolution in both lateral and vertical direction. Thanks to its relatively easy use, AFM can be well introduced in process control, gaining great advantage in research as well as in the evaluat......Atomic Force Microscopy (AFM) is a powerful technique providing 3D surface topographies with very high resolution in both lateral and vertical direction. Thanks to its relatively easy use, AFM can be well introduced in process control, gaining great advantage in research as well...

  15. Bose-Einstein condensation of heteronuclear bound states formed in a Fermi gas of two atomic species: a microscopic approach

    Science.gov (United States)

    Peletminskii, A. S.; Peletminskii, S. V.; Slyusarenko, Yu V.

    2017-07-01

    We study a many-body system of interacting fermionic atoms of two species that are in thermodynamic equilibrium with their condensed heteronuclear bound states (molecules). In order to describe such an equilibrium state, we use a microscopic approach that involves the Bogoliubov model for a weakly interacting Bose gas and approximate formulation of the second quantization method in the presence of bound states of particles elaborated earlier by the authors. This microscopic approach is valid at low temperatures, when the average kinetic energy of all the components in the system is small in comparison with the bound state energy. The coupled equations, which relate the chemical potentials of fermionic components and molecular condensate density, are obtained within the proposed theory. At zero temperature, these equations are analyzed both analytically and numerically, attracting the relevant experimental data. We find the conditions at which a condensate of heteronuclear molecules coexists in equilibrium with degenerate components of a Fermi gas. The ground state energy and single-particle excitation spectrum are found. The boundaries of the applicability of the developed microscopic approach are analyzed.

  16. Direct Microscopic Study of Doubly Polarized Atomic-Hydrogen by Electron-Spin Resonance

    NARCIS (Netherlands)

    van Yperen, G.H.; Silvera, I.F.; Walraven, J.T.M.; Berkhout, J.; Brisson, J.G.

    1983-01-01

    By means of ESR in a high magnetic field the hyperfine states of a gas of spin-polarized atomic hydrogen are directly probed. This allows a direct determination of the spin-state populations and nuclear polarization. The unusual ESR line shape is attributed to field inhomogeneities. The temperature

  17. Influence of atomic force microscope tip-sample interaction on the study of scaling behavior

    NARCIS (Netherlands)

    Aue, J.; de Hosson, J.T.M.

    1997-01-01

    Images acquired with atomic force microscopy are based on tip-sample interaction. It is shown that using scanning probe techniques for determining scaling parameters of a surface leads to an underestimate of the actual scaling dimension, due to the dilation of tip and surface. How much we underestim

  18. Atomic Resolution Imaging at an Ultralow Accelerating Voltage by a Monochromatic Transmission Electron Microscope

    Science.gov (United States)

    Morishita, Shigeyuki; Mukai, Masaki; Suenaga, Kazu; Sawada, Hidetaka

    2016-10-01

    Transmission electron microscopy using low-energy electrons would be very useful for atomic resolution imaging of specimens that would be damaged at higher energies. However, the resolution at low voltages is degraded because of geometrical and chromatic aberrations. In the present study, we diminish the effect of these aberrations by using a delta-type corrector and a monochromator. The dominant residual aberration in a delta-type corrector, which is the sixth-order three-lobe aberration, is counterbalanced by other threefold aberrations. Defocus spread caused by chromatic aberration is reduced by using a monochromated beam with an energy spread of 0.05 eV. We obtain images of graphene and demonstrate atomic resolution at an ultralow accelerating voltage of 15 kV.

  19. An integrated and multi-purpose microscope for the characterization of atomically thin optoelectronic devices

    CERN Document Server

    De Sanctis, Adolfo; Townsend, Nicola J; Craciun, Monica F; Russo, Saverio

    2016-01-01

    Optoelectronic devices based on graphene and other two-dimensional (2D) materials, such as transition metal dichalcogenides (TMDs) are the focus of wide research interest. They can be the key to improving bandwidths in telecommunications, capacity in data storage, new features in consumer electronics, safety devices and medical equipment. The characterization these emerging atomically thin materials and devices strongly relies on a set of measurements involving both optical and electronic instrumentation ranging from scanning photocurrent mapping to Raman and photoluminescence (PL) spectroscopy. Current state-of-the-art commercial instruments offer the ability to characterize individual properties of these materials with no option for the in situ characterization of a wide enough range of complementary optical and electrical properties. Presently, the requirement to switch atomically-thin materials from one system to another often radically affects the properties of these uniquely sensitive materials through ...

  20. Site-resolved imaging of single atoms with a Faraday quantum gas microscope

    CERN Document Server

    Yamamoto, Ryuta; Kato, Kohei; Kuno, Takuma; Sakura, Yuto; Takahashi, Yoshiro

    2016-01-01

    We successfully demonstrate a quantum gas microscopy using the Faraday effect which has an inherently non-destructive nature. The observed Faraday rotation angle reaches 3.0(2) degrees for a single atom. We reveal the non-destructive feature of this Faraday imaging method by comparing the detuning dependence of the Faraday signal strength with that of the photon scattering rate. We determine the atom distribution with deconvolution analysis. We also demonstrate the absorption and the dark field Faraday imaging, and reveal the different shapes of the point spread functions for these methods, which are fully explained by theoretical analysis. Our result is an important first step towards an ultimate quantum non-demolition site-resolved imaging and furthermore opens up the possibilities for quantum feedback control of a quantum many-body system with a single-site resolution.

  1. Neutron-induced 63Ni activity and microscopic observation of copper samples exposed to the Hiroshima atomic bomb

    Science.gov (United States)

    Shizuma, Kiyoshi; Endo, Satoru; Shinozaki, Kenji; Fukushima, Hiroshi

    2013-05-01

    Fast neutron activation data for 63Ni in copper samples exposed to the Hiroshima atomic bomb are important in evaluating neutron doses to the survivors. Up to until now, accelerator mass spectrometry and liquid scintillation counting methods have been applied in 63Ni measurements and data were accumulated within 1500 m from the hypocenter. The slope of the activation curve versus distance shows reasonable agreement with the calculation result, however, data near the hypocenter are scarce. In the present work, two copper samples obtained from the Atomic bomb dome (155 m from the hypocenter) and the Bank of Japan building (392 m) were utilized in 63Ni beta-ray measurement with a Si surface barrier detector. Additionally, microscopic observation of the metal surfaces was performed for the first time. Only upper limit of 63Ni production was obtained for copper sample of the Atomic bomb dome. The result of the 63Ni measurement for Bank of Japan building show reasonable agreement with the AMS measurement and to fast neutron activation calculations based on the Dosimetry System 2002 (DS02) neutrons.

  2. Atomic force microscope controlled topographical imaging and proximal probe thermal desorption/ionization mass spectrometry imaging.

    Science.gov (United States)

    Ovchinnikova, Olga S; Kjoller, Kevin; Hurst, Gregory B; Pelletier, Dale A; Van Berkel, Gary J

    2014-01-21

    This paper reports on the development of a hybrid atmospheric pressure atomic force microscopy/mass spectrometry imaging system utilizing nanothermal analysis probes for thermal desorption surface sampling with subsequent atmospheric pressure chemical ionization and mass analysis. The basic instrumental setup and the general operation of the system were discussed, and optimized performance metrics were presented. The ability to correlate topographic images of a surface with atomic force microscopy and a mass spectral chemical image of the same surface, utilizing the same probe without moving the sample from the system, was demonstrated. Co-registered mass spectral chemical images and atomic force microscopy topographical images were obtained from inked patterns on paper as well as from a living bacterial colony on an agar gel. Spatial resolution of the topography images based on pixel size (0.2 μm × 0.8 μm) was better than the resolution of the mass spectral images (2.5 μm × 2.0 μm), which were limited by current mass spectral data acquisition rate and system detection levels.

  3. Detection of single atoms and buried defects in three dimensions by aberration-corrected electron microscope with 0.5-A information limit.

    Science.gov (United States)

    Kisielowski, C; Freitag, B; Bischoff, M; van Lin, H; Lazar, S; Knippels, G; Tiemeijer, P; van der Stam, M; von Harrach, S; Stekelenburg, M; Haider, M; Uhlemann, S; Müller, H; Hartel, P; Kabius, B; Miller, D; Petrov, I; Olson, E A; Donchev, T; Kenik, E A; Lupini, A R; Bentley, J; Pennycook, S J; Anderson, I M; Minor, A M; Schmid, A K; Duden, T; Radmilovic, V; Ramasse, Q M; Watanabe, M; Erni, R; Stach, E A; Denes, P; Dahmen, U

    2008-10-01

    The ability of electron microscopes to analyze all the atoms in individual nanostructures is limited by lens aberrations. However, recent advances in aberration-correcting electron optics have led to greatly enhanced instrument performance and new techniques of electron microscopy. The development of an ultrastable electron microscope with aberration-correcting optics and a monochromated high-brightness source has significantly improved instrument resolution and contrast. In the present work, we report information transfer beyond 50 pm and show images of single gold atoms with a signal-to-noise ratio as large as 10. The instrument's new capabilities were exploited to detect a buried Sigma3 {112} grain boundary and observe the dynamic arrangements of single atoms and atom pairs with sub-angstrom resolution. These results mark an important step toward meeting the challenge of determining the three-dimensional atomic-scale structure of nanomaterials.

  4. An integrated and multi-purpose microscope for the characterization of atomically thin optoelectronic devices

    Science.gov (United States)

    De Sanctis, Adolfo; Jones, Gareth F.; Townsend, Nicola J.; Craciun, Monica F.; Russo, Saverio

    2017-05-01

    Optoelectronic devices based on graphene and other two-dimensional (2D) materials, such as transition metal dichalcogenides (TMDs), are the focus of wide research interest. They can be the key to improving bandwidths in telecommunications, capacity in data storage, and new features in consumer electronics, safety devices, and medical equipment. The characterization of these emerging atomically thin materials and devices strongly relies on a set of measurements involving both optical and electronic instrumentation ranging from scanning photocurrent mapping to Raman and photoluminescence (PL) spectroscopy. Furthermore, proof-of-concept devices are usually fabricated from micro-meter size flakes, requiring microscopy techniques to characterize them. Current state-of-the-art commercial instruments offer the ability to characterize individual properties of these materials with no option for the in situ characterization of a wide enough range of complementary optical and electrical properties. Presently, the requirement to switch atomically thin materials from one system to another often radically affects the properties of these uniquely sensitive materials through atmospheric contamination. Here, we present an integrated, multi-purpose instrument dedicated to the optical and electrical characterization of devices based on 2D materials which is able to perform low frequency electrical measurements, scanning photocurrent mapping, and Raman, absorption, and PL spectroscopy in one single setup with full control over the polarization and wavelength of light. We characterize this apparatus by performing multiple measurements on graphene, transition metal dichalcogenides (TMDs), and Si. The performance and resolution of each individual measurement technique is found to be equivalent to that of commercially available instruments. Contrary to nowadays' commercial systems, a significant advantage of the developed instrument is that for the first time the integration of a wide

  5. Micropore Structure Representation of Sandstone in Petroleum Reservoirs Using an Atomic Force Microscope

    Institute of Scientific and Technical Information of China (English)

    BAI Yong-Qiang; ZHU Xing; WU Jun-Zheng; BAI Wen-Guang

    2011-01-01

    @@ The pore structure of sandstone in an oil reservoir is investigated using atomic force microscopy(AFM).At nanoscale resolution,AFM images of sandstone show us the fine structure.The real height data of images display the three-dimensional space structure of sandstone effectively.The three-dimensional analysis results show that the AFM images of sandstone have unique characteristics that,like fingerprints,can identify different structural properties of sandstones.The results demonstrate that AFM is an effective method used to represent original sandstone in petroleum reservoirs,and may help geologists to appreciate the sandstone in oil reservoirs fully.

  6. MM99.50 - Surface Topography Characterization Using an Atomic Force Microscope Mounted on a Coordinate Measuring Machine

    DEFF Research Database (Denmark)

    Chiffre, Leonardo De; Hansen, Hans Nørgaard; Kofod, Niels

    1999-01-01

    The paper describes the construction, testing and use of an integrated system for topographic characterization of fine surfaces on parts having relatively big dimensions. An atomic force microscope (AFM) was mounted on a manual three-coordinate measuring machine (CMM) achieving free positioning o...... areas traced in single scans of 40 mu m x 40 mu m. The results show that surface mapping on industrial surfaces is possible using the Least Mean Square alignment provided by the AFM software....... values in the order of 1 nm. The positioning repeatability of the two horizontal axes of the CMM was determined to +/-1 mu m. Sets of four 20 mu m x 20 mu m areas were traced on fiat objects, combining the data into single 40 mu m x 40 mu m areas, and comparing the roughness values to those for the same...

  7. Sensitivity analysis of rectangular atomic force microscope cantilevers immersed in liquids based on the modified couple stress theory.

    Science.gov (United States)

    Lee, Haw-Long; Chang, Win-Jin

    2016-01-01

    The modified couple stress theory is adopted to study the sensitivity of a rectangular atomic force microscope (AFM) cantilever immersed in acetone, water, carbon tetrachloride (CCl4), and 1-butanol. The theory contains a material length scale parameter and considers the size effect in the analysis. However, this parameter is difficult to obtain via experimental measurements. In this study, a conjugate gradient method for the parameter estimation of the frequency equation is presented. The optimal method provides a quantitative approach for estimating the material length scale parameter based on the modified couple stress theory. The results show that the material length scale parameter of the AFM cantilever immersed in acetone, CCl4, water, and 1-butanol is 0, 25, 116.3, and 471 nm, respectively. In addition, the vibration sensitivities of the AFM cantilever immersed in these liquids are investigated. The results are useful for the design of AFM cantilevers immersed in liquids.

  8. Temperature and non-linear response of cantilever-type mechanical oscillators used in atomic force microscopes with interferometric detection

    Energy Technology Data Exchange (ETDEWEB)

    Fläschner, G.; Ruschmeier, K.; Schwarz, A., E-mail: aschwarz@physnet.uni-hamburg.de; Wiesendanger, R. [Institut für Angewandte Physik, Universität Hamburg, Jungiusstrasse 11, 20355 Hamburg (Germany); Bakhtiari, M. R.; Thorwart, M. [I. Institut für Theoretische Physik, Universität Hamburg, Jungiusstrae 9, 20355 Hamburg (Germany)

    2015-03-23

    The sensitivity of atomic force microscopes is fundamentally limited by the cantilever temperature, which can be, in principle, determined by measuring its thermal spectrum and applying the equipartition theorem. However, the mechanical response can be affected by the light field inside the cavity of a Fabry-Perot interferometer due to light absorption, radiation pressure, photothermal forces, and laser noise. By evaluating the optomechanical Hamiltonian, we are able to explain the peculiar distance dependence of the mechanical quality factor as well as the appearance of thermal spectra with symmetrical Lorentzian as well as asymmetrical Fano line shapes. Our results can be applied to any type of mechanical oscillator in an interferometer-based detection system.

  9. A new type of horizontal atomic force microscope%卧式原子力显微镜的研制

    Institute of Scientific and Technical Information of China (English)

    张冬仙; 黄峰

    2001-01-01

    提出原子力显微镜(AFM)的新设计,讨论卧式AFM的工作原理及其性能特点,简要介绍AFM的控制电路系统及其图像扫描和图像处理软件系统,给出AFM扫描获得的部分样品的图像结果。%A new design of horizontal atomic force microscope(AFM)was developed.The principle and characteristics of the new horizontal AFM were discussed.The control circuits and software systems for image scanning and processing were introduced.Some experimental results of image acquisition by using the horizontal AFM were also presented

  10. Atomic force microscopic study of the structure of high-density polyethylene deformed in liquid medium by crazing mechanism.

    Science.gov (United States)

    Bagrov, D V; Yarysheva, A Y; Rukhlya, E G; Yarysheva, L M; Volynskii, A L; Bakeev, N F

    2014-02-01

    A procedure has been developed for the direct atomic force microscopic (AFM) examination of the native structure of high-density polyethylene (HDPE) deformed in an adsorption-active liquid medium (AALM) by the crazing mechanism. The AFM investigation has been carried out in the presence of a liquid medium under conditions preventing deformed films from shrinkage. Deformation of HDPE in AALM has been shown to proceed through the delocalized crazing mechanism and result in the development of a fibrillar-porous structure. The structural parameters of the crazed polymer have been determined. The obtained AFM images demonstrate a nanosized nonuniformity of the deformation and enable one to observe the structural rearrangements that take place in the deformed polymer after removal of the liquid medium and stress relaxation. A structural similarity has been revealed between HDPE deformed in the AALM and hard elastic polymers.

  11. Temperature dependence of viscosity and density of viscous liquids determined from thermal noise spectra of uncalibrated atomic force microscope cantilevers.

    Science.gov (United States)

    McLoughlin, Neal; Lee, Stephen L; Hähner, Georg

    2007-08-01

    We demonstrate that the thermal response of uncalibrated atomic force microscope cantilevers can be used to extract the density and the viscosity of viscous liquids with good accuracy. Temperature dependent thermal noise spectra were measured in water/poly(ethylene glycol) mixtures. Empirical parameters characteristic of the resonance behavior of the system were extracted from data recorded for one of the solutions at room temperature. These parameters were then employed to determine both viscosity and density values of the solutions simultaneously at different temperatures. In addition, activation energies for viscous flow were determined from the viscosity values obtained. The method presented is both fast and reliable and has the potential to be applied in connection with microfluidic systems, making macroscopic amounts of liquid and separate measurements with a viscometer and a densimeter redundant.

  12. Bias-assisted atomic force microscope nanolithography on NbS2 thin films grown by chemical vapor deposition

    Science.gov (United States)

    Bark, Hunyoung; Kwon, Sanghyuk; Lee, Changgu

    2016-12-01

    Niobium disulfide, one of the metallic transition metal dichalcogenides, has a high potential as an electrode material for electronic devices made of 2D materials. Here, we investigated the bias-assisted atomic force microscope nanolithography of NbS2 thin films synthesized by chemical vapor deposition. We analyzed the lithographed pattern using Raman spectroscopy, transmission electron microscopy and friction force microscopy. These analyses showed that lines having various widths and thicknesses could be generated using the lithography technique by simply varying the scan speed and applied voltage. These analyses also revealed that the NbS2 film transformed from a layered crystalline structure into an amorphous structure upon being lithographed. By generating four line segments forming a square and measuring I/V curves inside and outside of the square, the electrical properties of the lithographed material were characterized. These analyses indicate that NbS2 became hydrogenated and an insulator upon being lithographed.

  13. Measurement of microscopic coupling constants between atoms on a surface: Combination of LEEM observation with lattice model analysis

    Science.gov (United States)

    Akutsu, Noriko

    2014-12-01

    We present a method combining low-energy electron microscopy (LEEM) and lattice model analysis for measuring the microscopic lateral coupling constants between atoms on a surface. The calculated step (interface) stiffness in a honeycomb lattice Ising model with the nearest neighbor and the second nearest neighbor interactions (J1 = 93.8 meV and J2 = 9.38 meV) matched the experimental step quantity values on an Si(111)(1 × 1) surface reported by Pang et al. and Bartelt et al. based on LEEM measurements. The experimental value of step tension obtained by Williams et al. lies on the calculated step tension curve. The polar graphs of the step tension and a two-dimensional island shape at the temperature T = 1163 K also agree well with the experimental graphs reported by Métois and Müller. The close agreement between the LEEM observations and the lattice model calculations on a Si(111) surface suggests that our method is also suitable for measuring microscopic lateral coupling constants on the surface of other materials that are less well-studied than Si.

  14. A single-cell scraper based on an atomic force microscope for detaching a living cell from a substrate

    Science.gov (United States)

    Iwata, Futoshi; Adachi, Makoto; Hashimoto, Shigetaka

    2015-10-01

    We describe an atomic force microscope (AFM) manipulator that can detach a single, living adhesion cell from its substrate without compromising the cell's viability. The micrometer-scale cell scraper designed for this purpose was fabricated from an AFM micro cantilever using focused ion beam milling. The homemade AFM equipped with the scraper was compact and standalone and could be mounted on a sample stage of an inverted optical microscope. It was possible to move the scraper using selectable modes of operation, either a manual mode with a haptic device or a computer-controlled mode. The viability of the scraped single cells was evaluated using a fluorescence dye of calcein-acetoxymethl ester. Single cells detached from the substrate were collected by aspiration into a micropipette capillary glass using an electro-osmotic pump. As a demonstration, single HeLa cells were selectively detached from the substrate and collected by the micropipette. It was possible to recultivate HeLa cells from the single cells collected using the system.

  15. A single-cell scraper based on an atomic force microscope for detaching a living cell from a substrate

    Energy Technology Data Exchange (ETDEWEB)

    Iwata, Futoshi, E-mail: iwata.futoshi@shizuoka.ac.jp [Department of Mechanical Engineering, Faculty of Engineering, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8561 (Japan); Research Institute of Electronics, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8011 (Japan); Adachi, Makoto; Hashimoto, Shigetaka [Department of Mechanical Engineering, Faculty of Engineering, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8561 (Japan)

    2015-10-07

    We describe an atomic force microscope (AFM) manipulator that can detach a single, living adhesion cell from its substrate without compromising the cell's viability. The micrometer-scale cell scraper designed for this purpose was fabricated from an AFM micro cantilever using focused ion beam milling. The homemade AFM equipped with the scraper was compact and standalone and could be mounted on a sample stage of an inverted optical microscope. It was possible to move the scraper using selectable modes of operation, either a manual mode with a haptic device or a computer-controlled mode. The viability of the scraped single cells was evaluated using a fluorescence dye of calcein-acetoxymethl ester. Single cells detached from the substrate were collected by aspiration into a micropipette capillary glass using an electro-osmotic pump. As a demonstration, single HeLa cells were selectively detached from the substrate and collected by the micropipette. It was possible to recultivate HeLa cells from the single cells collected using the system.

  16. System design and new applications for atomic force microscope based on tunneling

    Science.gov (United States)

    Wang, X.; Liu, A. P.; Yang, X. H.

    2015-09-01

    The design of atomic force microscopy (AFM) with high resolution is introduced in this paper. Mainly, we have developed the system design of the apparatus based on tunneling. AFM.IPC-208B, this kind of apparatus combines scanning tunnel microscopy (STM) and AFM availability, and its lens body with original frame enhances the capability of the machine. In order to analyze the performance of AFM.IPC-208B, as a new tool in the field of Life Science, we make use of the system to study natural mica and molecular protein structures of Cattle-insulin and human antibody immunoglobulin G (IgG) coupled with staphylococcus protein A (SPA). As the results of new applications, the resolution of AFM.IPC-208B is proved to be 0.1 nm, and these nanometer measurement results provide much valuable information for the study of small molecular proteins and HIV experiments.

  17. Humidity-Dependent Bacterial Cells Functional Morphometry Investigations Using Atomic Force Microscope

    Directory of Open Access Journals (Sweden)

    Hike Nikiyan

    2010-01-01

    Full Text Available The effect of a relative humidity (RH in a range of 93–65% on morphological and elastic properties of Bacillus cereus and Escherichia coli cells was evaluated using atomic force microscopy. It is shown that gradual dehumidification of bacteria environment has no significant effect on cell dimensional features and considerably decreases them only at 65% RH. The increasing of the bacteria cell wall roughness and elasticity occurs at the same time. Observed changes indicate that morphological properties of B. cereus are rather stable in wide range of relative humidity, whereas E. coli are more sensitive to drying, significantly increasing roughness and stiffness parameters at RH ≤ 84% RH. It is discussed the dependence of the response features on differences in cell wall structure of gram-positive and gram-negative bacterial cells.

  18. Femtosecond laser irradiation of indium phosphide in air: Raman spectroscopic and atomic force microscopic investigations

    Energy Technology Data Exchange (ETDEWEB)

    Bonse, J.; Wrobel, J.M.; Brzezinka, K.-W.; Esser, N.; Kautek, W

    2002-12-30

    Surface modification and ablation of crystalline indium phosphide was performed with single and double 130 fs pulses from a Ti:sapphire laser. The morphological features resulting from laser processing, have been investigated by means of micro Raman spectroscopy as well as by optical, atomic force and scanning electron microscopy. The studies indicate amorphous, ablated and recrystallized zones on the processed surface. In the single-pulse irradiation experimentsveral different threshold fluences could be assigned to the processes of melting, ablation and polycrystalline resolidification. Residual stress has been detected within the irradiated areas. Double-pulse exposure experiments have been analyzed in order to clarify the effect of cumulative damage in the ablation process of indium phosphide.

  19. Minimizing pulling geometry errors in atomic force microscope single molecule force spectroscopy.

    Science.gov (United States)

    Rivera, Monica; Lee, Whasil; Ke, Changhong; Marszalek, Piotr E; Cole, Daniel G; Clark, Robert L

    2008-10-01

    In atomic force microscopy-based single molecule force spectroscopy (AFM-SMFS), it is assumed that the pulling angle is negligible and that the force applied to the molecule is equivalent to the force measured by the instrument. Recent studies, however, have indicated that the pulling geometry errors can drastically alter the measured force-extension relationship of molecules. Here we describe a software-based alignment method that repositions the cantilever such that it is located directly above the molecule's substrate attachment site. By aligning the applied force with the measurement axis, the molecule is no longer undergoing combined loading, and the full force can be measured by the cantilever. Simulations and experimental results verify the ability of the alignment program to minimize pulling geometry errors in AFM-SMFS studies.

  20. The possibility of multi-layer nanofabrication via atomic force microscope-based pulse electrochemical nanopatterning.

    Science.gov (United States)

    Kim, Uksu; Morita, Noboru; Lee, Deug; Jun, Martin; Park, Jeong Woo

    2017-03-27

    Pulse electrochemical nanopatterning (PECN), a non-contact scanning probe lithography (NC-SPL) process using ultrashort voltage pulses, is based primarily on an electrochemical machining (ECM) process using localized electrochemical oxidation between a sharp tool tip and the sample surface. In this study, nanoscale oxide patterns were formed on silicon Si (100) wafer surfaces via electrochemical surface nanopatterning, by supplying external pulsed currents through non-contact atomic force microscopy. Nanoscale oxide width and height were controlled by modulating the applied pulse duration. Additionally, protruding nanoscale oxides were removed completely by simple chemical etching, showing a depressed pattern on the sample substrate surface. Nanoscale two-dimensional oxides, prepared by a localized electrochemical reaction, can be defined easily by controlling physical and electrical variables, before proceeding further to a layer-by-layer nanofabrication process.

  1. Competitive Adsorption between Bovine Serum Albumin and Collagen Observed by Atomic Force Microscope

    Institute of Scientific and Technical Information of China (English)

    Yong YU; Pei Qing YING; Gang JIN

    2004-01-01

    Atomic force microscopy (AFM) was used to study the competitive adsorption between bovine serum albumin (BSA) and type Ⅰ collagen on hydrophilic and hydrophobic silicon wafers.BSA showed a grain shape and the type I collagen displayed fibril-like molecules with relatively homogeneous height and width, characterized with clear twisting (helical formation). These AFM images illustrated that quite a lot of type I collagen appeared in the adsorption layer on hydrophilic surface in a competitive adsorption state, but the adsorption of BSA was more preponderant than that of type I collagen on hydrophobic silicon wafer surface. The experiments showed that the influence of BSA on type I collagen adsorption on hydrophilic surface was less than that on hydrophobic surface.

  2. Atomic force microscope tracking observation of Chinese hamster ovary cell mitosis.

    Science.gov (United States)

    Wu, Yangzhe; Cai, Jiye; Cheng, Longqiu; Xu, Yanfang; Lin, Zhiyan; Wang, Chenxi; Chen, Yong

    2006-01-01

    CHO cells possess easily identifiable karyotypes, and CHO cell chromosomes are large and few in number, making these cells ideal for mutational and drug toxicity studies and suitable for investigations of animal chromosome structure. Here, we used atomic force microscopy (AFM) in the tapping mode for detailed visualizations of Chinese hamster ovary (CHO) cell chromosomes during various mitotic phases, including typical prophase, prometaphase, metaphase, anaphase and telophase. Based on our detailed observations, we were able to divide metaphase and anaphase into sub-phases: metaphase I, II and III, and anaphase I and II. Furthermore, we used the AFM error-signal mode to visualize chromosomal ultrastructures and cytokinesis. While these visualizations were all successful, we found that the image quality was affected by cellular debris, contamination. Collectively, our results show that the AFM technique has great potential for the detailed study of chromosomes and chromosomal ultrastructures during all phases of the cell cycle, but that careful standards of sample preparation must be maintained.

  3. Continuous electrospinning of polymer nanofibers of Nylon-6 using an atomic force microscope tip.

    Science.gov (United States)

    Gururajan, Giriprasath; Sullivan, S P; Beebe, T P; Chase, D B; Rabolt, J F

    2011-08-01

    An atomic force microscopy (AFM) probe is successfully utilized as an electrospinning tip for fabricating Nylon-6 nanofibers. The nanometre-size tip enabled controlled deposition of uniform polymeric nanofibers within a 1 cm diameter area. Nylon-6 nanofibers were continuously electrospun at a solution concentration as low as 1 wt% Nylon-6 in 1,1,1,3,3,3-hexafluoro-2-propanol (HFIP). Wide-angle X-ray diffraction (WAXD) and differential scanning calorimetry (DSC) results of the AFM electrospun fibers indicated that the nanofibers predominantly display the meta-stable γ crystalline form suggesting rapid crystallization rate during the process. In addition to precise control over fiber deposition and diameter, some of the drawbacks of conventional electrospinning such as large volume of solutions and clogging of needles can be overcome using this AFM based electrospinning technique. Lastly, a comparison of electrospun fibers from syringe-needle based electrospinning and AFM probe-tip based electrospinning indicated significant morphological and microstructural differences in the case of AFM based electrospinning.

  4. Modified atomic force microscope applied to the measurement of elastic modulus for a single peptide molecule

    Science.gov (United States)

    Ptak, Arkadiusz; Takeda, Seiji; Nakamura, Chikashi; Miyake, Jun; Kageshima, Masami; Jarvis, Suzanne P.; Tokumoto, Hiroshi

    2001-09-01

    A modified atomic force microscopy (AFM) system, based on a force modulation technique, has been used to find an approximate value for the elastic modulus of a single peptide molecule directly from a mechanical test. For this purpose a self-assembled monolayer built from two kinds of peptides, reactive (able to anchor to the AFM tip) and nonreactive, was synthesized. In a typical experiment a single C3K30C (C=cysteine, K=lysine) peptide molecule was stretched between a Au(111) substrate and the gold-coated tip of an AFM cantilever to which it was attached via gold-sulfur bonds. The amplitude of the cantilever oscillations, due to an external force applied via a magnetic particle to the cantilever, was recorded by a lock-in amplifier and recalculated into stiffness of the stretched molecule. A longitudinal Young's modulus for the α-helix of a single peptide molecule and for the elongated state of this molecule has been estimated. The obtained values; 1.2±0.3 and 50±15 GPa, for the peptide α-helix and elongated peptide backbone, respectively, seem to be reasonable comparing them to the Young's modulus of protein crystals and linear organic polymers. We believe this research opens up a means by which scientists can perform quantitative studies of the elastic properties of single molecule, especially of biologically important polymers like peptides or DNA.

  5. Atomic force microscopic examination of chromosomes treated with trypsin or ethidium bromide.

    Science.gov (United States)

    Wu, Yangzhe; Cai, Jiye; Cheng, Longqiu; Yun, Keyu; Wang, Chenxi; Chen, Yong

    2006-04-01

    Trypsin treatment is frequently used during chromosome preparation for removal of cellular contaminants, and ethidium bromide (EB) staining of bands is often used to facilitate high-resolution observations by optical microscopy. However, conventional optical microscopy is unable to visualize potential aberrations of chromosome structures caused by these physicochemical treatments. In this article, we use atomic force microscopy (AFM) in the tapping mode to obtain and analyze high-resolution images of chromosome surface structure damage associated with trypsinization and EB treatment. According to our results, the trypsin-based digestion effects became more severe as incubations increased across a range from 10 to 40 s; a digestion time of 10 to 20 s appeared to be most suitable for observation by AFM. In terms of chromosomal damage induced by EB treatment, addition of EB into the media of cultured human blood cells induced chromosomal breakage in a dose-dependent fashion, and the results indicate centromeric region damnifyed severer than arms. Together, these results indicate that EB staining and the standard chromosomal preparative techniques of trypsinization can induce chromosomal damage that may affect the observed results.

  6. Field-ion microscopy observation of single-walled carbon nanotubes

    Institute of Scientific and Technical Information of China (English)

    张兆祥; 张耿民; 杜民; 金新喜; 侯士敏; 孙建平; 顾镇南; 赵兴钰; 刘惟敏; 吴锦雷; 薛增泉

    2002-01-01

    Field-ion microscopy (FIM), a tool for surface analysis with atomic resolution, has been employed to observethe end structure of single-walled carbon nanotubes (SWCNTs). FIM images revealed the existence of open SWCNTends. Amorphous carbon atoms were also observed to occur around SWCNTs and traditional field evaporation failedto remove them. Heat treatment was found to be efficacious in altering the end structures of SWCNT bundles. Carbonand oxygen atoms released from heated tungsten filament are believed to be responsible for the decoration imposed onthe SWCNT ends.

  7. Adsorption behavior of mercury on functionalized aspergillus versicolor mycelia: atomic force microscopic study.

    Science.gov (United States)

    Das, Sujoy K; Das, Akhil R; Guha, Arun K

    2009-01-06

    The adsorption characteristics of mercury on Aspergillus versicolor mycelia have been studied under varied environments. The mycelia are functionalized by carbon disulfide (CS(2)) treatment under alkaline conditions to examine the enhance uptake capacity and explore its potentiality in pollution control management. The functionalized A. versicolor mycelia have been characterized by scanning electron microscopy-energy dispersive X-ray analysis (SEM-EDXA), attenuated total reflection infrared (ATR-IR), and atomic force microscopy (AFM) probing. SEM and AFM images exhibit the formation of nanoparticles on the mycelial surface. ATR-IR profile confirms the functionalization of the mycelia following chemical treatment. ATR-IR and EDXA results demonstrate the binding of the sulfur groups of the functionalized mycelia to the mercury and consequent formation metal sulfide. AFM study reveals that the mycelial surface is covered by a layer of densely packed domain like structures. Sectional analysis yields significant increase in average roughness (R(rms)) value (20.5 +/- 1.82 nm) compared to that of the pristine mycelia (4.56 +/- 0.82 nm). Surface rigidity (0.88 +/- 0.06 N/m) and elasticity (92.6 +/- 10.2 MPa) obtained from a force distance curve using finite element modeling are found to increase significantly with respect to the corresponding values of (0.65 +/- 0.05 N/m and 32.8 +/- 4.5 MPa) of the nonfunctionalized mycelia. The maximum mercury adsorption capacity of the functionalized mycelia is observed to be 256.5 mg/g in comparison to 80.71 mg/g for the pristine mycelia.

  8. The neon gas field ion source-a first characterization of neon nanomachining properties

    Energy Technology Data Exchange (ETDEWEB)

    Livengood, Richard H., E-mail: richard.h.livengood@intel.com [Intel Corporation, Intel Architecture Group, Santa Clara, CA (United States); Tan, Shida; Hallstein, Roy [Intel Corporation, Intel Architecture Group, Santa Clara, CA (United States); Notte, John; McVey, Shawn; Faridur Rahman, F.H.M. [Carl Zeiss SMT, Nano Technology Systems Division, Peabody, MA (United States)

    2011-07-21

    At the Charged Particle Optics Conference (CPO7) in 2006, a novel trimer based helium gas field ion source (GFIS) was introduced for use in a new helium ion microscope (HIM), demonstrating the novel source performance attributes and unique imaging applications of the HIM (Hill et al., 2008 ; Livengood et al., 2008). Since that time there have been numerous enhancements to the HIM source and platform demonstrating resolution scaling into the sub 0.5 nm regime (Scipioni et al., 2009 ; Pickard et al., 2010). At this Charged Particle Optics Conference (CPO8) we will be introducing a neon version of the trimer-GFIS co-developed by Carl Zeiss SMT and Intel Corporation. The neon source was developed as a possible supplement to the gallium liquid metal ion source (LMIS) used today in most focused ion beam (FIB) systems (Abramo et al., 1994 ; Young et al.,1998). The neon GFIS source has low energy spread ({approx}1 eV) and a small virtual source size (sub-nanometer), similar to that of the helium GFIS. However neon does differ from the helium GFIS in two significant ways: neon ions have high sputtering yields (e.g. 1 Si atom per incident ion at 20 keV); and have relatively shallow implant depth (e.g. 46 nm in silicon at 20 keV). Both of these are limiting factors for helium in many nanomachining applications. In this paper we will present both simulation and experimental results of the neon GFIS used for imaging and nanomachining applications.

  9. Atomic force and optical near-field microscopic investigations of polarization holographic gratings in a liquid crystalline azobenzene side-chain polyester

    DEFF Research Database (Denmark)

    Ramanujam, P.S.; Holme, N.C.R.; Hvilsted, S.

    1996-01-01

    Atomic force and scanning near-field optical microscopic investigations have been carried out on a polarization holographic grating recorded in an azobenzene side-chain Liquid crystalline polyester. It has been found that immediately following laser irradiation, a topographic surface grating...

  10. Ultracold few fermionic atoms in needle-shaped double wells: spin chains and resonating spin clusters from microscopic Hamiltonians emulated via antiferromagnetic Heisenberg and t-J models

    Science.gov (United States)

    Yannouleas, Constantine; Brandt, Benedikt B.; Landman, Uzi

    2016-07-01

    Advances with trapped ultracold atoms intensified interest in simulating complex physical phenomena, including quantum magnetism and transitions from itinerant to non-itinerant behavior. Here we show formation of antiferromagnetic ground states of few ultracold fermionic atoms in single and double well (DW) traps, through microscopic Hamiltonian exact diagonalization for two DW arrangements: (i) two linearly oriented one-dimensional, 1D, wells, and (ii) two coupled parallel wells, forming a trap of two-dimensional, 2D, nature. The spectra and spin-resolved conditional probabilities reveal for both cases, under strong repulsion, atomic spatial localization at extemporaneously created sites, forming quantum molecular magnetic structures with non-itinerant character. These findings usher future theoretical and experimental explorations into the highly correlated behavior of ultracold strongly repelling fermionic atoms in higher dimensions, beyond the fermionization physics that is strictly applicable only in the 1D case. The results for four atoms are well described with finite Heisenberg spin-chain and cluster models. The numerical simulations of three fermionic atoms in symmetric DWs reveal the emergent appearance of coupled resonating 2D Heisenberg clusters, whose emulation requires the use of a t-J-like model, akin to that used in investigations of high T c superconductivity. The highly entangled states discovered in the microscopic and model calculations of controllably detuned, asymmetric, DWs suggest three-cold-atom DW quantum computing qubits.

  11. Optical and atomic force microscopic study on step bunching in BaB2O4 crystal growth

    Institute of Scientific and Technical Information of China (English)

    Pan Xiu-Hong; Jin Wei-Qing; Liu Yan; Ai Fei; Jin Fei; Xie Jun-Jie

    2011-01-01

    The formation of macrostep during high-temperature phase of barium meta-borate (α-BaB2O4) single crystal growth has been investigated by both optical in-situ observation system and atomic force microscopy (AFM). The in-situ observation results demonstrate that the critical linear size of growing facet exceeding the size that the macrostep generates is significantly anisotropic. The critical linear sizes are around 280 μm and 620 μm for {10(1)0} and {(1)010} planes, respectively. AFM study illustrates that macrostep train with a height of 150 nm~200 nm is one typical morphological feature of the as-grown crystal surface. The riser of each macrostep consists of several straight and parallel sub-steps, indicating the occurrence of step bunching. Additionally, triangular sub-steps with heights of several nanometers on the treads of the macrosteps are found to be another typical feature of surface morphology, which implies a microscopically competitive bunching of sub-steps between various crystallographic orientations.

  12. Measurements of dispersion forces between colloidal latex particles with the atomic force microscope and comparison with Lifshitz theory.

    Science.gov (United States)

    Elzbieciak-Wodka, Magdalena; Popescu, Mihail N; Montes Ruiz-Cabello, F Javier; Trefalt, Gregor; Maroni, Plinio; Borkovec, Michal

    2014-03-14

    Interaction forces between carboxylate colloidal latex particles of about 2 μm in diameter immersed in aqueous solutions of monovalent salts were measured with the colloidal probe technique, which is based on the atomic force microscope. We have systematically varied the ionic strength, the type of salt, and also the surface charge densities of the particles through changes in the solution pH. Based on these measurements, we have accurately measured the dispersion forces acting between the particles and estimated the apparent Hamaker constant to be (2.0 ± 0.5) × 10(-21) J at a separation distance of about 10 nm. This value is basically independent of the salt concentration and the type of salt. Good agreement with Lifshitz theory is found when roughness effects are taken into account. The combination of retardation and roughness effects reduces the value of the apparent Hamaker constant and its ionic strength dependence with respect to the case of ideally smooth surfaces.

  13. Piezoelectric bimorph-based scanner in the tip-scan mode for high speed atomic force microscope.

    Science.gov (United States)

    Zhao, Jianyong; Gong, Weitao; Cai, Wei; Shang, Guangyi

    2013-08-01

    A piezoelectric bimorph-based scanner operating in tip-scan mode for high speed atomic force microscope (AFM) is first presented. The free end of the bimorph is used for fixing an AFM cantilever probe and the other one is mounted on the AFM head. The sample is placed on the top of a piezoelectric tube scanner. High speed scan is performed with the bimorph that vibrates at the resonant frequency, while slow scanning is carried out by the tube scanner. The design and performance of the scanner is discussed and given in detailed. Combined with a commercially available data acquisition system, a high speed AFM has been built successfully. By real-time observing the deformation of the pores on the surface of a commercial piezoelectric lead zirconate titanate (PZT-5) ceramics under electric field, the dynamic imaging capability of the AFM is demonstrated. The results show that the notable advantage of the AFM is that dynamic process of the sample with large dimensions can be easily investigated. In addition, this design could provide a way to study a sample in real time under the given experimental condition, such as under an external electric field, on a heating stage, or in a liquid cell.

  14. A miniaturized, high frequency mechanical scanner for high speed atomic force microscope using suspension on dynamically determined points

    Energy Technology Data Exchange (ETDEWEB)

    Herfst, Rodolf; Dekker, Bert; Witvoet, Gert; Crowcombe, Will; Lange, Dorus de [Department of Optomechatronics, Netherlands Organization for Applied Scientific Research, TNO, Delft (Netherlands); Sadeghian, Hamed, E-mail: hamed.sadeghianmarnani@tno.nl, E-mail: h.sadeghianmarnani@tudelft.nl [Department of Optomechatronics, Netherlands Organization for Applied Scientific Research, TNO, Delft (Netherlands); Department of Precision and Microsystems Engineering, Delft University of Technology, Delft (Netherlands)

    2015-11-15

    One of the major limitations in the speed of the atomic force microscope (AFM) is the bandwidth of the mechanical scanning stage, especially in the vertical (z) direction. According to the design principles of “light and stiff” and “static determinacy,” the bandwidth of the mechanical scanner is limited by the first eigenfrequency of the AFM head in case of tip scanning and by the sample stage in terms of sample scanning. Due to stringent requirements of the system, simply pushing the first eigenfrequency to an ever higher value has reached its limitation. We have developed a miniaturized, high speed AFM scanner in which the dynamics of the z-scanning stage are made insensitive to its surrounding dynamics via suspension of it on specific dynamically determined points. This resulted in a mechanical bandwidth as high as that of the z-actuator (50 kHz) while remaining insensitive to the dynamics of its base and surroundings. The scanner allows a practical z scan range of 2.1 μm. We have demonstrated the applicability of the scanner to the high speed scanning of nanostructures.

  15. A miniaturized, high frequency mechanical scanner for high speed atomic force microscope using suspension on dynamically determined points.

    Science.gov (United States)

    Herfst, Rodolf; Dekker, Bert; Witvoet, Gert; Crowcombe, Will; de Lange, Dorus; Sadeghian, Hamed

    2015-11-01

    One of the major limitations in the speed of the atomic force microscope (AFM) is the bandwidth of the mechanical scanning stage, especially in the vertical (z) direction. According to the design principles of "light and stiff" and "static determinacy," the bandwidth of the mechanical scanner is limited by the first eigenfrequency of the AFM head in case of tip scanning and by the sample stage in terms of sample scanning. Due to stringent requirements of the system, simply pushing the first eigenfrequency to an ever higher value has reached its limitation. We have developed a miniaturized, high speed AFM scanner in which the dynamics of the z-scanning stage are made insensitive to its surrounding dynamics via suspension of it on specific dynamically determined points. This resulted in a mechanical bandwidth as high as that of the z-actuator (50 kHz) while remaining insensitive to the dynamics of its base and surroundings. The scanner allows a practical z scan range of 2.1 μm. We have demonstrated the applicability of the scanner to the high speed scanning of nanostructures.

  16. Measurements of dispersion forces between colloidal latex particles with the atomic force microscope and comparison with Lifshitz theory

    Energy Technology Data Exchange (ETDEWEB)

    Elzbieciak-Wodka, Magdalena; Ruiz-Cabello, F. Javier Montes; Trefalt, Gregor; Maroni, Plinio; Borkovec, Michal, E-mail: michal.borkovec@unige.ch [Department of Inorganic and Analytical Chemistry, University of Geneva, Sciences II, 30, Quai Ernest-Ansermet, 1205 Geneva (Switzerland); Popescu, Mihail N. [Ian Wark Research Institute, University of South Australia, Mawson Lakes, SA 5095 (Australia)

    2014-03-14

    Interaction forces between carboxylate colloidal latex particles of about 2 μm in diameter immersed in aqueous solutions of monovalent salts were measured with the colloidal probe technique, which is based on the atomic force microscope. We have systematically varied the ionic strength, the type of salt, and also the surface charge densities of the particles through changes in the solution pH. Based on these measurements, we have accurately measured the dispersion forces acting between the particles and estimated the apparent Hamaker constant to be (2.0 ± 0.5) × 10{sup −21} J at a separation distance of about 10 nm. This value is basically independent of the salt concentration and the type of salt. Good agreement with Lifshitz theory is found when roughness effects are taken into account. The combination of retardation and roughness effects reduces the value of the apparent Hamaker constant and its ionic strength dependence with respect to the case of ideally smooth surfaces.

  17. High-speed spiral imaging technique for an atomic force microscope using a linear quadratic Gaussian controller

    Science.gov (United States)

    Habibullah, H.; Pota, H. R.; Petersen, I. R.

    2014-03-01

    This paper demonstrates a high-speed spiral imaging technique for an atomic force microscope (AFM). As an alternative to traditional raster scanning, an approach of gradient pulsing using a spiral line is implemented and spirals are generated by applying single-frequency cosine and sine waves of slowly varying amplitudes to the X and Y-axes of the AFM's piezoelectric tube scanner (PTS). Due to these single-frequency sinusoidal input signals, the scanning process can be faster than that of conventional raster scanning. A linear quadratic Gaussian controller is designed to track the reference sinusoid and a vibration compensator is combined to damp the resonant mode of the PTS. An internal model of the reference sinusoidal signal is included in the plant model and an integrator for the system error is introduced in the proposed control scheme. As a result, the phase error between the input and output sinusoids from the X and Y-PTSs is reduced. The spirals produced have particularly narrow-band frequency measures which change slowly over time, thereby making it possible for the scanner to achieve improved tracking and continuous high-speed scanning rather than being restricted to the back and forth motion of raster scanning. As part of the post-processing of the experimental data, a fifth-order Butterworth filter is used to filter noises in the signals emanating from the position sensors and a Gaussian image filter is used to filter the images. A comparison of images scanned using the proposed controller (spiral) and the AFM PI controller (raster) shows improvement in the scanning rate using the proposed method.

  18. High-speed spiral imaging technique for an atomic force microscope using a linear quadratic Gaussian controller

    Energy Technology Data Exchange (ETDEWEB)

    Habibullah, H., E-mail: h.habib@student.adfa.edu.au; Pota, H. R., E-mail: h.pota@adfa.edu.au; Petersen, I. R., E-mail: i.petersen@adfa.edu.au [School of Engineering and Information Technology, University of New South Wales, Canberra, Australian Capital Territory 2612 (Australia)

    2014-03-15

    This paper demonstrates a high-speed spiral imaging technique for an atomic force microscope (AFM). As an alternative to traditional raster scanning, an approach of gradient pulsing using a spiral line is implemented and spirals are generated by applying single-frequency cosine and sine waves of slowly varying amplitudes to the X and Y-axes of the AFM’s piezoelectric tube scanner (PTS). Due to these single-frequency sinusoidal input signals, the scanning process can be faster than that of conventional raster scanning. A linear quadratic Gaussian controller is designed to track the reference sinusoid and a vibration compensator is combined to damp the resonant mode of the PTS. An internal model of the reference sinusoidal signal is included in the plant model and an integrator for the system error is introduced in the proposed control scheme. As a result, the phase error between the input and output sinusoids from the X and Y-PTSs is reduced. The spirals produced have particularly narrow-band frequency measures which change slowly over time, thereby making it possible for the scanner to achieve improved tracking and continuous high-speed scanning rather than being restricted to the back and forth motion of raster scanning. As part of the post-processing of the experimental data, a fifth-order Butterworth filter is used to filter noises in the signals emanating from the position sensors and a Gaussian image filter is used to filter the images. A comparison of images scanned using the proposed controller (spiral) and the AFM PI controller (raster) shows improvement in the scanning rate using the proposed method.

  19. High-speed spiral imaging technique for an atomic force microscope using a linear quadratic Gaussian controller.

    Science.gov (United States)

    Habibullah, H; Pota, H R; Petersen, I R

    2014-03-01

    This paper demonstrates a high-speed spiral imaging technique for an atomic force microscope (AFM). As an alternative to traditional raster scanning, an approach of gradient pulsing using a spiral line is implemented and spirals are generated by applying single-frequency cosine and sine waves of slowly varying amplitudes to the X and Y-axes of the AFM's piezoelectric tube scanner (PTS). Due to these single-frequency sinusoidal input signals, the scanning process can be faster than that of conventional raster scanning. A linear quadratic Gaussian controller is designed to track the reference sinusoid and a vibration compensator is combined to damp the resonant mode of the PTS. An internal model of the reference sinusoidal signal is included in the plant model and an integrator for the system error is introduced in the proposed control scheme. As a result, the phase error between the input and output sinusoids from the X and Y-PTSs is reduced. The spirals produced have particularly narrow-band frequency measures which change slowly over time, thereby making it possible for the scanner to achieve improved tracking and continuous high-speed scanning rather than being restricted to the back and forth motion of raster scanning. As part of the post-processing of the experimental data, a fifth-order Butterworth filter is used to filter noises in the signals emanating from the position sensors and a Gaussian image filter is used to filter the images. A comparison of images scanned using the proposed controller (spiral) and the AFM PI controller (raster) shows improvement in the scanning rate using the proposed method.

  20. Electrical conductivity in Langmuir-Blodgett films of n-alkyl cyanobiphenyls using current sensing atomic force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Gayathri, H. N.; Suresh, K. A., E-mail: suresh@cnsms.res.in [Centre for Nano and Soft Matter Sciences, P. B. No. 1329, Jalahalli, Bangalore 560013 (India)

    2015-06-28

    We report our studies on the nanoscale electrical conductivity in monolayers of n-alkyl cyanobiphenyl materials deposited on solid surface. Initially, the 8CB, 9CB, and 10CB monolayer films were prepared by the Langmuir technique at air-water interface and characterized by surface manometry and Brewster angle microscopy. The monolayer films were transferred on to solid substrates by the Langmuir-Blodgett (L-B) technique. The 8CB, 9CB, and 10CB monolayer L-B films were deposited on freshly cleaved mica and studied by atomic force microscope (AFM), thereby measuring the film thickness as ∼1.5 nm. The electrical conductivity measurements were carried out on 9CB and 10CB monolayer L-B films deposited onto highly ordered pyrolytic graphite using current sensing AFM. The nanoscale current-voltage (I-V) measurements show a non-linear variation. The nature of the curve indicates electron tunneling to be the mechanism for electrical conduction. Furthermore, analysis of the I-V curve reveals a transition in the electron conduction mechanism from direct tunneling to injection tunneling. From the transition voltage, we have estimated the values of barrier height for 9CB and 10CB to be 0.71 eV and 0.37 eV, respectively. For both 9CB and 10CB, the effective mass of electron was calculated to be 0.021 m{sub e} and 0.065 m{sub e}, respectively. These parameters are important in the design of molecular electronic devices.

  1. Phenotypic and genotypic characterization of biofilm formation among Staphylococcus aureus isolates from clinical specimens, an Atomic Force Microscopic (AFM) study.

    Science.gov (United States)

    Bazari, Pelin Aslani Menareh; Honarmand Jahromy, Sahar; Zare Karizi, Shohreh

    2017-09-01

    Staphylococcus aureus is a major cause of nosocomial infections. Biofilm formation is an important factor for bacterial pathogenesis. Its mechanisms are complex and include of many genes depends on expression of icaADBC operon involved in the synthesis of a polysaccharide intercellular adhesion. The aim of study was to investigate biofilm forming ability of Staphylococcus aureus strains by phenotypic and genotypic methods. Also Atomic Force microscope (AFM) was used to visualize biofilm formation. 140 Isolates were collected from clinical specimens of patients in Milad Hospital, Tehran and diagnosed by biochemical tests. The ability of strains to produce slime was evaluated by CRA method. For diagnosing of bacterial EPS, Indian ink staining were used and finally biofilm surface of 3 isolates observed by AFM. The prevalence of icaA and icaD genes was determined by PCR. By CRA method 15% of samples considered as positive slime producers, 44.28% as intermediate and 40.71% indicative as negative slime producers. 118 staphylococcus aureus strains showed a distinct halo transparent zone but 22 strains showed no halo zone. AFM analysis of Slime positive isolates showed a distinct and complete biofilm formation. In slime negative strain, there was not observed biofilm. The prevalence of icaA, icaD genes was 44.2% and 10% of the isolates had both genes simultaneously. There is a relationship between exopolysaccharide layer and biofilm formation of Staphylococcus aureus isolates. The presence of icaAD genes among isolates is not associated with in vitro formation of biofilm. AFM is a useful tool for observation of bacterial biofilm formation. Copyright © 2017 Elsevier Ltd. All rights reserved.

  2. Pattern of Hydroxyapatite Crystal Growth on Bleached Enamel Following the Application of Two Antioxidants: An Atomic Force Microscope Study.

    Science.gov (United States)

    Bhusari, Chitra P; Sharma, Divya S

    This study observed the topographical pattern of hydroxyapatite deposition and growth (D&G) on bleached enamel following application of two antioxidants (sodium ascorbate and catalase) using atomic force microscope. Twenty enamel specimens (4×3×2mm), prepared from extracted impacted third molars, were mounted in self-cure acrylic and randomly grouped as: Group I-untreated; Group II- 35%H2O2; Group III- 35%H2O2 + artificial saliva; Group IV- 35%H2O2 + catalase+ artificial saliva; Group V- 35%H2O2 + sodium ascorbate+ artificial saliva. Groups I and II were observed immediately after treatment. Groups III-V were observed after 72 hrs. Roughness average was also calculated and analyzed with non-parametric Kruskall-Wallis ANOVA and Mann-Whitney tests. H2O2 dissolved matrix, exposed hydroxyapatite crystals (HACs), causing dissolution on the sides of and within HACs and opening up of nano-spaces. Artificial saliva showed growth of dissoluted crystals. Antioxidants+saliva showed potentiated remineralization by D&G on dissoluted HACs of bleached enamel. Catalase potentiated blockshaped, while sodium ascorbate the needle-shaped crystals with stair-pattern of crystallization. Evidence of oxygen bubbles was a new finding with catalase. Maximum roughness average was in group V followed by group II > group IV > group III > group I. Post-bleaching application of catalase and sodium ascorbate potentiated remineralization by saliva, but in different patterns. None of the tested antioxidant could return the original topography of enamel.

  3. Suppression of single cesium atom heating in a microscopic optical dipole trap for demonstration of an 852nm triggered single-photon source

    CERN Document Server

    Liu, Bei; He, Jun; Wang, Junmin

    2016-01-01

    We investigate single cesium (Cs) atom heating owing to the momentum accumulation process induced by the resonant pulsed excitation in a microscopic optical dipole trap formed by a strongly focused 1064 nm laser beam. The heating depends on the trap frequency which restricts the maximum repetition rate of pulsed excitation. We experimentally verify the heating of a single atom and then demonstrate how to suppress it with an optimized pulsed excitation/cooling method. The typical trap lifetime of single Cs atom is extended from 108 +/- 6 us to 2536 +/- 31 ms, and the corresponding number of excitation increases from ~ 108 to ~ 360000. In applying this faster cooling method, we use the trapped single Cs atom as a triggered single-photon source at an excitation repetition rate of 10 MHz. The second-order intensity correlations of the emitted single photons are characterized by implementing Hanbury Brown and Twiss setup, and clear anti-bunching effect has been observed.

  4. Thermal Diffusion of Si Atoms at the Interface of Mo/Si Bilayers Studied with a Soft X-ray Emission Microscope

    Institute of Scientific and Technical Information of China (English)

    2001-01-01

    Thermal diffusion of Si atoms at the interface in Mo/Si multilayers was observed with an imaging-type soft-X-ray emission microscope developed by us. It was possible to observe the diffusion with 0.2nm depth resolution in the direction normal to the interface by comparing the emission intensity for exactly the same position. The diffusion coefficient of Si atoms in Mo at 600℃ was roughly estimated to be 6.0×10-17cm2/s.

  5. Wide-range length metrology by dual-imaging-unit atomic force microscope based on porous alumina.

    Science.gov (United States)

    Zhang, Dongxian; Zhang, Haijun; Lin, Xiaofeng

    2004-06-15

    A new dual-imaging-unit atomic force microscope (DIU-AFM) was developed for wide-range length metrology. In the DIU-AFM, two AFM units were combined, one as a reference unit, and the other a test one. Their probes with Z piezo elements and tips were horizontally set in parallel at the same height to reduce errors due to geometric asymmetry. An XY scanner was attached to an XY block that was able to move in the X direction with a step of about 500 nm. A standard porous alumina film was employed as the reference sample. Both reference sample and test sample were installed at the center of the XY scanner on the same surface and were simultaneously imaged. The two images had the same lateral size, and thus the length of the test sample image could be accurately measured by counting the number of periodic features of the reference one. The XY block together with the XY scanner were next moved in the X direction for about 1.5 microm and a second pair of reference and test images were obtained by activating the scanner. In this way, a series of pairs of images were acquired and could be spliced into two wide-range reference and test images, respectively. Again, the two spliced images were of the same size and the length of test image was measured based on the reference one. This article presents a discussion about the structure and control of the DIU-AFM system. Some experiments were carried out on the system to demonstrate the method of length calculation and measurement. Experiments show a satisfactory result of wide-range length metrology based on the hexagonal features of the porous alumina with a periodic length of several tens of nanometers. Using this method the DIU-AFM is capable of realizing nanometer-order accuracy length metrology when covering a wide range from micron to several hundreds of microns, or even up to millimeter order.

  6. Single-molecule force spectroscopy studies of fibrin 'A-a' polymerization interactions via the atomic force microscope

    Science.gov (United States)

    Averett, Laurel E.

    Fibrin, the polymerized form of the soluble plasma protein fibrinogen, plays a critical role in hemostasis as the structural scaffold of blood clots. The primary functions of fibrin are to withstand the shear forces of blood flow and provide mechanical stability to the clot, protecting the wound. While studies have investigated the mechanical properties of fibrin constructs, the response to force of critical polymerization interactions such as the 'A--a' knob--hole interaction remains unclear. Herein, the response of the 'A--a' bond to force was examined at the single-molecule level using the atomic force microscope. Force spectroscopy methodology was developed to examine the 'A--a' interaction while reducing the incidence of both nonspecific and multiple molecule interactions. The rupture of this interaction resulted in a previously unreported characteristic force profile comprised of up to four events. We hypothesized that the first event represented reorientation of the fibrinogen molecule, the second and third represented unfolding of structures in the D region of fibrinogen, and the last event was the rupture of the 'A--a' bond weakened by prior structural unfolding. The configuration, molecular extension, and kinetic parameters of each event in the characteristic pattern were examined to compare the unfolding of fibrin to other proteins unfolded by force. Fitting the pattern with polymer models showed that the D region of fibrinogen could lengthen by ˜50% of the length of a fibrin monomer before rupture of the 'A--a' bond. Analysis showed that the second and third events had kinetic parameters similar to other protein structures unfolded by force. Studies of the dependence of the characteristic pattern on calcium, concentration of sodium chloride, pH, and temperature demonstrated that the incidence of the last event was affected by solution conditions. However, only low pH and high temperatures reduced the probability that an interaction was characteristic

  7. Atoms

    Institute of Scientific and Technical Information of China (English)

    刘洪毓

    2007-01-01

    Atoms(原子)are all around us.They are something like the bricks (砖块)of which everything is made. The size of an atom is very,very small.In just one grain of salt are held millions of atoms. Atoms are very important.The way one object acts depends on what

  8. High-speed broadband nanomechanical property quantification and imaging of life science materials using atomic force microscope

    Science.gov (United States)

    Ren, Juan

    Nanoscale morphological characterization and mechanical properties quantification of soft and biological materials play an important role in areas ranging from nano-composite material synthesis and characterization, cellular mechanics to drug design. Frontier studies in these areas demand the coordination between nanoscale morphological evolution and mechanical behavior variations through simultaneous measurement of these two aspects of properties. Atomic force microscope (AFM) is very promising in achieving such simultaneous measurements at high-speed and broadband owing to its unique capability in applying force stimuli and then, measuring the response at specific locations in a physiologically friendly environment with pico-newton force and nanometer spatial resolution. Challenges, however, arise as current AFM systems are unable to account for the complex and coupled dynamics of the measurement system and probe-sample interaction during high-speed imaging and broadband measurements. In this dissertation, the creation of a set of dynamics and control tools to probe-based high-speed imaging and rapid broadband nanomechanical spectroscopy of soft and biological materials are presented. Firstly, advanced control-based approaches are presented to improve the imaging performance of AFM imaging both in air and in liquid. An adaptive contact mode (ACM) imaging scheme is proposed to replace the traditional contact mode (CM) imaging by addressing the major concerns in both the speed and the force exerted to the sample. In this work, the image distortion caused by the topography tracking error is accounted for in the topography quantification and the quantified sample topography is utilized in a gradient-based optimization method to adjust the cantilever deflection set-point for each scanline closely around the minimal level needed for maintaining a stable probe-sample contact, and a data-driven iterative feedforward control that utilizes a prediction of the next

  9. Radiation pressure excitation of a low temperature atomic force/magnetic force microscope for imaging in 4-300 K temperature range

    Science.gov (United States)

    Ćelik, Ümit; Karcı, Özgür; Uysallı, Yiǧit; Özer, H. Özgür; Oral, Ahmet

    2017-01-01

    We describe a novel radiation pressure based cantilever excitation method for imaging in dynamic mode atomic force microscopy (AFM) for the first time. Piezo-excitation is the most common method for cantilever excitation, however it may cause spurious resonance peaks. Therefore, the direct excitation of the cantilever plays a crucial role in AFM imaging. A fiber optic interferometer with a 1310 nm laser was used both for the excitation of the cantilever at the resonance and the deflection measurement of the cantilever in a commercial low temperature atomic force microscope/magnetic force microscope (AFM/MFM) from NanoMagnetics Instruments. The laser power was modulated at the cantilever's resonance frequency by a digital Phase Locked Loop (PLL). The laser beam is typically modulated by ˜500 μW, and ˜141.8 nmpp oscillation amplitude is obtained in moderate vacuum levels between 4 and 300 K. We have demonstrated the performance of the radiation pressure excitation in AFM/MFM by imaging atomic steps in graphite, magnetic domains in CoPt multilayers between 4 and 300 K and Abrikosov vortex lattice in BSCCO(2212) single crystal at 4 K for the first time.

  10. 原子力显微镜在生命科学中的应用%The application of atomic force microscope in life science

    Institute of Scientific and Technical Information of China (English)

    曾洁铭; 曾耀英; 蔡继业; 肇静娴

    2001-01-01

    During the past few years, atomic force microscope (AFM) isbecoming a powerful tool in life science research. With their high-resolution and capability to image under aqueous solution, AFM is applied to investigate the structure of biomolecules and biological process in real time. From visualization of DNA and IgG to DNA transcription, the advances in sample preparation methods have made these events come true. In addition, AFM can be used in molecular recognition. This article illustrates these major achievements of AFM in biological studies.

  11. Four-probe scanning tunnelling microscope with atomic resolution for electrical and electro-optical property measurements of nanosystems

    Institute of Scientific and Technical Information of China (English)

    Lin Xiao; He Xiao-Bo; Lu Jun-Ling; Gao Li; Huan Qing; Shi Dong-Xia; Gao Hong-Jun

    2005-01-01

    We demonstrate a special four-probe scanning tunnelling microscope (STM) system in ultrahigh vacuum (UHV),which can provide coarse positioning for every probe independently with the help of scanning electron microscope (SEM)and fine positioning down to nanometre using the STM technology. The system allows conductivity measurement by means of a four-point probe method, which can draw out more accurate electron transport characteristics in nanostructures, and provides easy manipulation of low dimension materials. All measurements can be performed in variable temperature (from 30K to 500K), magnetic field (from 0 to 0.1T), and different gas environments. Simultaneously, the cathodoluminescence (CL) spectrum can be achieved through an optical subsystem. Test measurements using some nanowire samples show that this system is a powerful tool in exploring electron transport characteristics and spectra in nanoscale physics.

  12. Microscopic theory of dipole-dipole interaction in ensembles of impurity atoms in a Fabry-Perot cavity

    Science.gov (United States)

    Kuraptsev, A. S.; Sokolov, I. M.

    2016-08-01

    We develop a consistent quantum theory of the collective effects that take place when electromagnetic radiation interacts with a dense ensemble of impurity centers embedded in a transparent dielectric and placed in a Fabry-Perot cavity. We have calculated the spontaneous decay dynamics of an excited impurity atom as a specific example of applying the developed general theory. We analyze the dependence of the decay rate on the density of impurity centers and the sample sizes as well as on the characteristic level shifts of impurity atoms caused by the internal fields of the dielectric. We show that a cavity can affect significantly the pattern of collective processes, in particular, the lifetimes of collective states.

  13. Atomic resolution imaging of YAlO3: Ce in the chromatic and spherical aberration corrected PICO electron microscope.

    Science.gov (United States)

    Jin, Lei; Barthel, Juri; Jia, Chun-Lin; Urban, Knut W

    2017-01-31

    The application of combined chromatic and spherical aberration correction in high-resolution transmission electron microscopy enables a significant improvement of the spatial resolution down to 50 pm. We demonstrate that such a resolution can be achieved in practice at 200kV. Diffractograms of images of gold nanoparticles on amorphous carbon demonstrate corresponding information transfer. The Y atom pairs in [010] oriented yttrium orthoaluminate are successfully imaged together with the Al and the O atoms. Although the 57 pm pair separation is well demonstrated separations between 55 pm and 80 pm are measured. This observation is tentatively attributed to structural relaxations and surface reconstruction in the very thin samples used. Quantification of the resolution limiting effective image spread is achieved based on an absolute match between experimental and simulated image intensity distributions.

  14. High resolution transmission electron microscope Imaging and first-principles simulations of atomic-scale features in graphene membrane

    Science.gov (United States)

    Wang, Wei; Bhandari, Sagar; Yi, Wei; Bell, David; Westervelt, Robert; Kaxiras, Efthimios

    2012-02-01

    Ultra-thin membranes such as graphene[1] are of great importance for basic science and technology applications. Graphene sets the ultimate limit of thinness, demonstrating that a free-standing single atomic layer not only exists but can be extremely stable and strong [2--4]. However, both theory [5, 6] and experiments [3, 7] suggest that the existence of graphene relies on intrinsic ripples that suppress the long-wavelength thermal fluctuations which otherwise spontaneously destroy long range order in a two dimensional system. Here we show direct imaging of the atomic features in graphene including the ripples resolved using monochromatic aberration-corrected transmission electron microscopy (TEM). We compare the images observed in TEM with simulated images based on an accurate first-principles total potential. We show that these atomic scale features can be mapped through accurate first-principles simulations into high resolution TEM contrast. [1] Geim, A. K. & Novoselov, K. S. Nat. Mater. 6, 183-191, (2007). [2] Novoselov, K. S.et al. Science 306, 666-669, (2004). [3] Meyer, J. C. et al. Nature 446, 60-63, (2007). [4] Lee, C., Wei, X. D., Kysar, J. W. & Hone, J. Science 321, 385-388, (2008). [5] Nelson, D. R. & Peliti, L. J Phys-Paris 48, 1085-1092, (1987). [6] Fasolino, A., Los, J. H. & Katsnelson, M. I. Nat. Mater. 6, 858-861, (2007). [7] Meyer, J. C. et al. Solid State Commun. 143, 101-109, (2007).

  15. Spatial dependence of polycrystalline FTO’s conductance analyzed by conductive atomic force microscope (C-AFM)

    Energy Technology Data Exchange (ETDEWEB)

    Peixoto, Alexandre Pessoa; Costa, J. C. da [Department of Electrical Engineering, University of Brasília, Campus Universitário Darcy Ribeiro, Asa Norte, PO Box 4386, Brasília - DF, 70919-970 (Brazil)

    2014-05-15

    Fluorine-doped Tin oxide (FTO) is a highly transparent, electrically conductive polycrystalline material frequently used as an electrode in organic solar cells and optical-electronic devices [1–2]. In this work a spatial analysis of the conductive behavior of FTO was carried out by Conductive-mode Atomic Force Microscopy (C-AFM). Rare highly oriented grains sample give us an opportunity to analyze the top portion of polycrystalline FTO and compare with the border one. It is shown that the current flow essentially takes place through the polycrystalline edge at grain boundaries.

  16. Oligo(ethylene glycol)-terminated monolayers on silicon surfaces and their nanopatterning with a conductive atomic force microscope

    Institute of Scientific and Technical Information of China (English)

    2010-01-01

    Functionalization of silicon substrate surfaces with a stable monolayer for resisting non-specific adsorption of proteins has attracted great interest,since it is directly relevant to the development of miniature,silicon-based biosensors and implantable microdevices,such as silicon-neuron interfaces.This brief review summarizes our contribution to the development of robust monolayers grown by surface hydrosilylation on atomically flat,hydrogen-terminated silicon surfaces.The review also outlines our strategy and progress on the fabrication of single molecule patterns on such monolayer platforms.

  17. [Connection of magnetic antisense probe with SK-Br-3 oncocyte mRNA nucleotide detected by high resolution atomic force microscope].

    Science.gov (United States)

    Tan, Shude; Ouyang, Yu; Li, Xinyou; Wen, Ming; Li, Shaolin

    2011-06-01

    The present paper is aimed to detect superparamagnetic iron oxide labeled c-erbB2 oncogene antisense oligonucleotide probe (magnetic antisense probe) connected with SK-Br-3 oncocyte mRNA nucleotide by high resolution atomic force microscope (AFM). We transfected SK-Br-3 oncocyte with magnetic antisense probe, then observed the cells by AFM with high resolution and detected protein expression and magnetic resonance imagine (MRI). The high resolution AFM clearly showed the connection of the oligonucleotide remote end of magnetic antisense probe with the mRNA nucleotide of oncocyte. The expression of e-erbB2 protein in SK-Br3 cells were highly inhibited by using magnetic antisense probe. We then obtained the lowest signal to noise ratio (SNR) of SK-Br-3 oncocyte transfected with magnetic antisense probe by MRI (PSK-Br-3 mRNA of tumor cell nuclear.

  18. Power spectrum analysis with least-squares fitting: Amplitude bias and its elimination, with application to optical tweezers and atomic force microscope cantilevers

    DEFF Research Database (Denmark)

    Nørlykke, Simon F.; Flyvbjerg, Henrik

    2010-01-01

    Optical tweezers and atomic force microscope (AFM) cantilevers are often calibrated by fitting their experimental power spectra of Brownian motion. We demonstrate here that if this is done with typical weighted least-squares methods, the result is a bias of relative size between -2/n and + 1/n....... The fitted value for the characteristic frequency is not affected by this bias. For the AFM then, force measurements are not affected provided an independent length-scale calibration is available. For optical tweezers there is no such luck, since the spring constant is found as the ratio...... of the characteristic frequency and the diffusion coefficient. We give analytical results for the weight-dependent bias for the wide class of systems whose dynamics is described by a linear (integro)differential equation with additive noise, white or colored. Examples are optical tweezers with hydrodynamic self...

  19. Effect of the interaction conditions of the probe of an atomic-force microscope with the n-GaAs surface on the triboelectrization phenomenon

    Energy Technology Data Exchange (ETDEWEB)

    Baklanov, A. V., E-mail: baklanov@mail.ioffe.ru [St. Petersburg State Polytechnical University, Institute of Physics, Nanotechnology, and Telecommunications (Russian Federation); Gutkin, A. A.; Kalyuzhnyy, N. A. [Russian Academy of Sciences, Ioffe Institute (Russian Federation); Brunkov, P. N. [St. Petersburg State Polytechnical University, Institute of Physics, Nanotechnology, and Telecommunications (Russian Federation)

    2015-08-15

    Triboelectrization as a result of the scanning of an atomic-force-microscope probe over an n-GaAs surface in the contact mode is investigated. The dependences of the local potential variation on the scanning rate and the pressing force of the probe are obtained. The results are explained by point-defect formation in the surface layers of samples under the effect of deformation of these layers during probe scanning. The charge localized at these defects in the case of equilibrium changes the potential of surface, which is subject to triboelectrization. It is shown that, for qualitative explanation of the observed dependences, it is necessary to take into account both the generation and annihilation of defects in the region experiencing deformation.

  20. Effects of a slow harmonic displacement on an Atomic Force Microscope system under Lennard-Jones forces

    Directory of Open Access Journals (Sweden)

    Khadraoui Morad

    2016-01-01

    Full Text Available We focus in this paper on the modeling and dynamical analysis of a tapping mode atomic force microscopy (AFM. The microbeam is subjected to a low frequency harmonic displacement of its base and to the Lennard-Jones (LJ forces at its free end. Static and modal analysis are performed for various gaps between the tip of the microbeam and a sample. The Galerkin method is employed to reduce the equations of motion to a fast-slow dynamical system. We show that the dynamics of the AFM system is governed by the contact and the noncontact invariant slow manifolds. The tapping mode is triggered via two saddle-node bifurcations of these manifolds. Moreover, the contact time is computed and the effects of the base motion amplitude and the initial gap are discussed.

  1. Research on a Diamond Tip Wear Mechanism in Atomic Force Microscope-based Micro/nano-machining

    Institute of Scientific and Technical Information of China (English)

    2001-01-01

    The object is to investigate the wear of an atomic forcemicroscope (AFM) diamond tip when conducting micro/nano-machining on single crystal silicon surface. The experimental research and theoretical analysis were carried out on the worn tip in terms of wear rate, wear mechanism and the effect of the tip wear on micro-machining process. The wear rate was calculated as 1.7(10~10mm3/(N*m) by using a theoretical model combined with the experimental results. Through an integration of an AFM observation on the worn tip features with the FEM simulation of the stress distribution, in addition to the unit cutting force calculation on the AFM diamond tip, the wear mechanism of the AFM diamond tip was concluded as mainly chemical wear, and the wear process was also elaborated as well.

  2. Si2Sb2Te5 phase change material studied by an atomic force microscope nano-tip

    Institute of Scientific and Technical Information of China (English)

    Liu Yanbo; Zhang Ting; Niu Xiaoming; Song Zhitang; Min Guoquan; Zhang Jing; Zhou Weimin; Wan Yongzhong; Zhang Jianping; Li Xiaoli; Feng Songlin

    2009-01-01

    The Si2Sb2Te5 phase change material has been studied by applying a nano-tip (30 nm in diameter) on an atomic force microscopy system. Memory switching from a high resistance state to a low resistance state has been achieved, with a resistance change of about 1000 times. In a typical Ⅰ-Ⅴ curve, the current increases significantly after the voltage exceeds~4.3 V. The phase transformation of a Si2Sb2Te5 film was studied in situ by means of in situ X-ray diffraction and temperature dependent resistance measurements. The thermal stability of Si2Sb2Te5 and Ge2Sb2Te5 was characterized and compared as well.

  3. Note: Guaranteed collocated multimode control of an atomic force microscope cantilever using on-chip piezoelectric actuation and sensing

    Science.gov (United States)

    Ruppert, Michael G.; Yong, Yuen K.

    2017-08-01

    The quality (Q) factor is an important parameter of the resonance of the microcantilever as it determines both imaging bandwidth and force sensitivity. The ability to control the Q factor of multiple modes is believed to be of great benefit for atomic force microscopy techniques involving multiple eigenmodes. In this paper, we propose a novel cantilever design employing multiple piezoelectric transducers which are used for separated actuation and sensing, leading to guaranteed collocation of the first eight eigenmodes up to 3 MHz. The design minimizes the feedthrough usually observed with these systems by incorporating a guard trace on the cantilever chip. As a result, a multimode Q controller is demonstrated to be able to modify the quality factor of the first two eigenmodes over up to four orders of magnitude without sacrificing robust stability.

  4. Direct method for magnetostriction coefficient measurement based on atomic force microscope, illustrated by the example of Tb–Co film

    Energy Technology Data Exchange (ETDEWEB)

    Lima, B.L.S. [Laboratório de Sensores Óticos, Escola Politécnica, Universidade de São Paulo, SP (Brazil); Maximino, F.L. [Laboratório de Materiais Magnéticos, Instituto de Física, Universidade de São Paulo, CEP:05314-970 São Paulo, SP (Brazil); Santos, J.C. [Laboratório de Sensores Óticos, Escola Politécnica, Universidade de São Paulo, SP (Brazil); Santos, A.D., E-mail: adsantos@if.usp.br [Laboratório de Materiais Magnéticos, Instituto de Física, Universidade de São Paulo, CEP:05314-970 São Paulo, SP (Brazil)

    2015-12-01

    This paper presents a method based on the Atomic Force Microscopy technique for direct measurement of magnetostriction coefficient of amorphous Tb–Co films deposited on Si(100) substrate. The magnetostriction coefficient of the film is determined by AFM measuring the deflection of the sample when applying a magnetic field. In order to maximize the deflection of the sample, in-plane magnetic anisotropy was induced by heat treatment under a magnetic field of 5 kOe. The value obtained for the saturation magnetostriction is 204×10{sup −6} for the Tb{sub 23}Co{sub 77} film. - Highlights: • Measurement of magnetostriction coefficient using AFM. • Tb–Co thin films produced by magnetron sputtering. • Magnetostriction characterization of magnetic thin films on nonmagnetic substrates.

  5. Electron transport in dodecylamine capped gold nanocluster films using current sensing atomic force microscope (C-AFM).

    Science.gov (United States)

    Chaudhary, Minakshi; Dey, Shirshendu; Date, Kalyani; Iyyer, S B; Dharmadhikaril, C V

    2009-09-01

    Electron transport across cataphoretically deposited dodecylamine capped gold nanocluster rough films on Si(111) substrate is investigated using current sensing atomic force microscopy. Contact mode images depict uniform deposition of agglomerates of gold nanoparticles. The current images display strong correlation with topographic images. The I-V measurement on a single agglomerate of approximately = 250 nm size at different forces exhibits force dependent threshold voltage. The electron transport from tip to sample is found to be ohmic in contrast to that from sample to tip which, exhibits Fowler-Nordheim behavior up to 35 nN force. At higher forces, the I-V behavior could be attributed to other electron transfer processes such as Schottky/Poole-Frenkel or trapping/detrapping, although no exact mechanism could be identified. The results are discussed in the light of models based on Coulomb blockaded collective charge transport in nanoparticle arrays duly accounting for the potential role of the capping layer.

  6. Formation and characterization of thin films from phthalocyanine complexes: An electrosynthesis study using the atomic-force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Sanchez Vergara, M.E. [Departamento de Ingenieria Mecatronica, Escuela de Ingenieria, Universidad Anahuac del Norte, Avenida Lomas de la Anahuac s/n, Col. Lomas Anahuac, 52786, Huixquilucan (Mexico)]. E-mail: elena.sanchez@anahuac.mx; Islas Bernal, I.F. [Instituto de Fisica, Universidad Nacional Autonoma de Mexico, Circuito Exterior, Ciudad Universitaria, 04510, Mexico D.F. (Mexico); Rivera, M. [Instituto de Fisica, Universidad Nacional Autonoma de Mexico, Circuito Exterior, Ciudad Universitaria, 04510, Mexico D.F. (Mexico); Ortiz Rebollo, A. [Instituto de Investigaciones en Materiales, Universidad Nacional Autonoma de Mexico, A.P. 70-360, Coyoacan, 04510, Mexico, D.F. (Mexico); Alvarez Bada, J.R. [Instituto Tecnologico y de Estudios Superiores de Monterrey, Campus Ciudad de Mexico, Calle del Puente 222, Col. Ejidos de Huipulco, 14380, Mexico D.F. (Mexico)

    2007-05-07

    ({mu}-Cyano)(phthalocyaninato)metal(III) [PcMCN]{sub n} species with a central transition metal ion, such as Fe(III) and Co(III), were used to prepare molecular films on a highly oriented pyrolytic graphite electrode substrate by using the cyclic voltammetry technique. In order to investigate the influence of the ligand on the film properties, 1,8-dihydroxyanthraquinone and 2,6-dihydroxyanthraquinone as bivalent ligands were employed. The structure of the molecular materials was analyzed by infrared spectroscopy. The in situ film formation, texture, composition and conductivity of each film were further investigated using atomic force microscopy, scanning electron microscopy, energy-dispersive X-ray spectroscopy and the four-probe technique, respectively. The [PcMCN]{sub n} complexes provided conductive films with an electrical conductivity of 1 x 10{sup -6} {omega}{sup -1} cm{sup -1} at 298 K.

  7. Microscopic Polyangiitis

    Science.gov (United States)

    ... are here: Home / Types of Vasculitis / Microscopic Polyangiitis Microscopic Polyangiitis First Description Who gets Microscopic Polyangiitis (the “ ... differences as to justify separate classifications. Who gets Microscopic Polyangiitis? A typical patient MPA can affect individuals ...

  8. Atomic force microscopic study of aggregation of RecA-DNA nucleoprotein filaments into left-handed supercoiled bundles.

    Science.gov (United States)

    Shi, Wei-Xian; Larson, Ronald G

    2005-12-01

    RecA and its complexes with double-stranded DNA (dsDNA) and single-stranded DNA (ssDNA) are responsible for homologous recombination and DNA repair. In this study, we have observed, by atomic force microscopy (AFM), two-filament left-handed superhelices of RecA-dsDNA filaments that further interwind into four- or six-filament bundles, in addition to previously reported left-handed bundles of three or six filaments. Also revealed are four-filament bundles formed by further interwinding of two intrafilament superhelices of individual filaments. Pitches of superhelices of RecA-DNA filaments are similar to each other regardless the number of component filaments, and those formed on Phix174 RFII dsDNA and pNEB206A dsDNA are measured as 339.3 +/- 6.2 nm (690 counts of pitch/2) and 321.6 +/- 11.7 nm (101 counts of pitch/2), respectively, consistent with earlier measurements made by electron microscopy with a much smaller sample size. The study of these structures provides insight into the self-interactions of RecA and RecA-like proteins, which are present in all living cells, and into the general phenomenon of bundling, which is relevant to both biological and nonbiological filaments.

  9. Method of mechanical holding of cantilever chip for tip-scan high-speed atomic force microscope

    Science.gov (United States)

    Fukuda, Shingo; Uchihashi, Takayuki; Ando, Toshio

    2015-06-01

    In tip-scan atomic force microscopy (AFM) that scans a cantilever chip in the three dimensions, the chip body is held on the Z-scanner with a holder. However, this holding is not easy for high-speed (HS) AFM because the holder that should have a small mass has to be able to clamp the cantilever chip firmly without deteriorating the Z-scanner's fast performance, and because repeated exchange of cantilever chips should not damage the Z-scanner. This is one of the reasons that tip-scan HS-AFM has not been established, despite its advantages over sample stage-scan HS-AFM. Here, we present a novel method of cantilever chip holding which meets all conditions required for tip-scan HS-AFM. The superior performance of this novel chip holding mechanism is demonstrated by imaging of the α3β3 subcomplex of F1-ATPase in dynamic action at ˜7 frames/s.

  10. Atomic force microscopic view of the fine topography on the tobacco stigma surface during its response to pollination

    Institute of Scientific and Technical Information of China (English)

    WU Hui; LI Meng; SUN MengXiang

    2008-01-01

    During compatible pollination in tobacco, an extracellular matrix (ECM) is secreted from the stigma surface; however, it is unknown whether the pattern of secretion across the stigma depends on the pollen source. In fact, technical limitations have prevented clear observation of ECM secretion. Here, we report the detailed topographic changes on the stigma surface that accompanies intraspecies and interspecies pollination in tobacco using contact mode atomic force microscopy (AFM). Our results, which show the dynamics and time course of ECM secretion after pollination, indicate that a certain pattern of secretion already exists on the stigma prior to pollination. Intraspecies induced a two-step response, characterized by topograPhical changes on the stigma surface several hours after pollina-tion, which was distinct from the pattern of ECM secretion induced by interspecies pollination. This difference was confirmed by root-mean-square analysis, which assessed the roughness of the stigma surface. Our findings indicate that compatible pollination not only induces ECM secretion from the stigma, but also results in a specific distribution of the ECM. Thus, this study demonstrates the pow-erful potential of AFM in studying the pollen-stigma interaction.

  11. A measurement of the hysteresis loop in force-spectroscopy curves using a tuning-fork atomic force microscope

    Directory of Open Access Journals (Sweden)

    Manfred Lange

    2012-03-01

    Full Text Available Measurements of the frequency shift versus distance in noncontact atomic force microscopy (NC-AFM allow measurements of the force gradient between the oscillating tip and a surface (force-spectroscopy measurements. When nonconservative forces act between the tip apex and the surface the oscillation amplitude is damped. The dissipation is caused by bistabilities in the potential energy surface of the tip–sample system, and the process can be understood as a hysteresis of forces between approach and retraction of the tip. In this paper, we present the direct measurement of the whole hysteresis loop in force-spectroscopy curves at 77 K on the PTCDA/Ag/Si(111 √3 × √3 surface by means of a tuning-fork-based NC-AFM with an oscillation amplitude smaller than the distance range of the hysteresis loop. The hysteresis effect is caused by the making and breaking of a bond between PTCDA molecules on the surface and a PTCDA molecule at the tip. The corresponding energy loss was determined to be 0.57 eV by evaluation of the force–distance curves upon approach and retraction. Furthermore, a second dissipation process was identified through the damping of the oscillation while the molecule on the tip is in contact with the surface. This dissipation process occurs mainly during the retraction of the tip. It reaches a maximum value of about 0.22 eV/cycle.

  12. A microscopic particle-vibration coupling approach for atomic nuclei. Giant resonance properties and the renormalization of the effective interaction

    CERN Document Server

    Brenna, Marco

    2014-01-01

    The self-consistent mean-field (SCMF) theory describes many properties of the ground state and excited states of the atomic nucleus, such as masses, radii, deformations and giant resonance energies. SCMF models are based on the independent particle picture where nucleons are assumed to move in a self-generated average potential. In the first part of this work, we apply a state-of-the-art SCMF approach, based on the Skyrme effective interaction, to two different excitations (viz. the pygmy dipole resonance and the isovector giant quadrupole resonance), investigating their relation with the nuclear matter symmetry energy, which corresponds to the energy cost for changing protons into neutrons and is a key parameter for the nuclear equation of state. However, SCMF models present well known limitations which require the inclusion of further dynamical correlations, e.g. the ones coming from the interweaving between single-particle and collective degrees of freedom (particle-vibration coupling - PVC). In the second...

  13. Method of mechanical holding of cantilever chip for tip-scan high-speed atomic force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Fukuda, Shingo [Department of Physics, College of Science and Engineering, Kanazawa University, Kakuma-machi, Kanazawa 920-1192 (Japan); Uchihashi, Takayuki; Ando, Toshio [Department of Physics, College of Science and Engineering, Kanazawa University, Kakuma-machi, Kanazawa 920-1192 (Japan); Bio-AFM Frontier Research Center, College of Science and Engineering, Kanazawa University, Kakuma-machi, Kanazawa 920-1192 (Japan); Core Research for Evolutional Science and Technology of the Japan Science and Technology Agency, 7 Goban-cho, Chiyoda-ku, Tokyo 102-0076 (Japan)

    2015-06-15

    In tip-scan atomic force microscopy (AFM) that scans a cantilever chip in the three dimensions, the chip body is held on the Z-scanner with a holder. However, this holding is not easy for high-speed (HS) AFM because the holder that should have a small mass has to be able to clamp the cantilever chip firmly without deteriorating the Z-scanner’s fast performance, and because repeated exchange of cantilever chips should not damage the Z-scanner. This is one of the reasons that tip-scan HS-AFM has not been established, despite its advantages over sample stage-scan HS-AFM. Here, we present a novel method of cantilever chip holding which meets all conditions required for tip-scan HS-AFM. The superior performance of this novel chip holding mechanism is demonstrated by imaging of the α{sub 3}β{sub 3} subcomplex of F{sub 1}-ATPase in dynamic action at ∼7 frames/s.

  14. Optimizing 1-μs-Resolution Single-Molecule Force Spectroscopy on a Commercial Atomic Force Microscope.

    Science.gov (United States)

    Edwards, Devin T; Faulk, Jaevyn K; Sanders, Aric W; Bull, Matthew S; Walder, Robert; LeBlanc, Marc-Andre; Sousa, Marcelo C; Perkins, Thomas T

    2015-10-14

    Atomic force microscopy (AFM)-based single-molecule force spectroscopy (SMFS) is widely used to mechanically measure the folding and unfolding of proteins. However, the temporal resolution of a standard commercial cantilever is 50-1000 μs, masking rapid transitions and short-lived intermediates. Recently, SMFS with 0.7-μs temporal resolution was achieved using an ultrashort (L = 9 μm) cantilever on a custom-built, high-speed AFM. By micromachining such cantilevers with a focused ion beam, we optimized them for SMFS rather than tapping-mode imaging. To enhance usability and throughput, we detected the modified cantilevers on a commercial AFM retrofitted with a detection laser system featuring a 3-μm circular spot size. Moreover, individual cantilevers were reused over multiple days. The improved capabilities of the modified cantilevers for SMFS were showcased by unfolding a polyprotein, a popular biophysical assay. Specifically, these cantilevers maintained a 1-μs response time while eliminating cantilever ringing (Q ≅ 0.5). We therefore expect such cantilevers, along with the instrumentational improvements to detect them on a commercial AFM, to accelerate high-precision AFM-based SMFS studies.

  15. An atomic force microscopic investigation of surface degradation of potassium hydrogen phthalate (KAP) crystals caused by removal from solution

    Science.gov (United States)

    Ester, G. R.; Price, R.; Halfpenny, P. J.

    1997-12-01

    Atomic force microscopy (AFM) has been used to examine the nature and extent of surface degradation of the {0 1 0} faces of potassium hydrogen phthalate (KAP) crystals removed from aqueous solution. Crystals separated from their growth solutions by passage through a layer of n-hexane or using a jet of n-hexane exhibited clearly preserved growth spirals. The step terraces, however, were found to be extensively pitted, typically to a depth of approximately 1.4 nm which corresponds to one lattice spacing in the b-direction. In addition to such nanoscale pitting, larger pits several microns in lateral dimensions were also observed. These were frequently hexagonal in shape usually with a shallow mound within or adjacent to the pit. More rapid removal of solution from crystal surfaces was effected using a pulse of compressed air or argon. Under optimised conditions this approach yielded much better surface protection with step terraces in this case being essentially smooth. Step heights on the spirals shown were found to be 1.4 ± 0.2 nm and thus of single unit cell height. The occurrence of pits on the terraces is attributed to deposition of KAP by two dimensional nucleation on the terraces, producing partial coverage and thus the apparently pitted surface.

  16. Evaluation of the interactions between polymeric chains and surfaces with different structures performed by an atomic force microscope

    Directory of Open Access Journals (Sweden)

    Oréfice Rodrigo Lambert

    1998-01-01

    Full Text Available Interactions between polymers and inorganic surfaces are present in a series of phenomena involving processes such as coagulation and deffloculation of ceramic powder and adsorption of organic macromolecules on the surface of implants, among others. In this work, Atomic Force Microscopy (AFM was modified to allow the evaluation of interactions between polymeric chains and inorganic surfaces (silica with different structures. Polymers (sulfonated polysulfone were grafted onto AFM cantilevers. AFM force-distance curves were obtained for this modified tip against a series of substrates produced by depositing silica films on silicon wafers. The structure of the silica layer was modified by employing heat treatments at different temperatures. The results showed that the interactions between polymer and surfaces are dependent on the structure of the surfaces. Penetration of the polymeric chains can occur through a soft gel layer (substrates treated at low temperature, 110 °C. For surfaces with dense silica layers, the results showed that not only the concentration of hydroxy groups but also their spatial distribution along the surfaces are important in defining the magnitude of interactions between polymers and surfaces. A model involving a molecular recognition process, in which interactions are maximized for inorganic surfaces with structures that can match the chemical architecture of the polymer, was then used to explain the obtained results.

  17. Parameters affecting the adhesion strength between a living cell and a colloid probe when measured by the atomic force microscope.

    Science.gov (United States)

    McNamee, Cathy E; Pyo, Nayoung; Tanaka, Saaya; Vakarelski, Ivan U; Kanda, Yoichi; Higashitani, Ko

    2006-03-15

    In this study, we used the colloid probe atomic force microscopy (AFM) technique to investigate the adhesion force between a living cell and a silica colloid particle in a Leibovitz's L-15 medium (L-15). The L-15 liquid maintained the pharmaceutical conditions necessary to keep the cells alive in the outside environment during the AFM experiment. The force curves in such a system showed a steric repulsion in the compression force curve, due to the compression of the cells by the colloid probe, and an adhesion force in the decompression force curve, due to binding events between the cell and the probe. We also investigated for the first time how the position on the cell surface, the strength of the pushing force, and the residence time of the probe at the cell surface individually affected the adhesion force between a living cell and a 6.84 microm diameter silica colloid particle in L-15. The position of measuring the force on the cell surface was seen not to affect the value of the maximum adhesion force. The loading force was also seen not to notably affect the value of the maximum adhesion force, if it was small enough not to pierce and damage the cell. The residence time of the probe at the cell surface, however, clearly affected the adhesion force, where a longer residence time gave a larger maximum force. From these results, we could conclude that the AFM force measurements should be made using a loading force small enough not to damage the cell and a fixed residence time, when comparing results of different systems.

  18. Line-edge quality optimization of electron beam resist for high-throughput character projection exposure utilizing atomic force microscope analysis

    Science.gov (United States)

    Ikeno, Rimon; Mita, Yoshio; Asada, Kunihiro

    2017-04-01

    High-throughput electron-beam lithography (EBL) by character projection (CP) and variable-shaped beam (VSB) methods is a promising technique for low-to-medium volume device fabrication with regularly arranged layouts, such as standard-cell logics and memory arrays. However, non-VLSI applications like MEMS and MOEMS may not fully utilize the benefits of CP method due to their wide variety of layout figures including curved and oblique edges. In addition, the stepwise shapes that appear on such irregular edges by VSB exposure often result in intolerable edge roughness, which may degrade performances of the fabricated devices. In our former study, we proposed a general EBL methodology for such applications utilizing a combination of CP and VSB methods, and demonstrated its capabilities in electron beam (EB) shot reduction and edge-quality improvement by using a leading-edge EB exposure tool, ADVANTEST F7000S-VD02, and high-resolution Hydrogen Silsesquioxane resist. Both scanning electron microscope and atomic force microscope observations were used to analyze quality of the resist edge profiles to determine the influence of the control parameters used in the exposure-data preparation process. In this study, we carried out detailed analysis of the captured edge profiles utilizing Fourier analysis, and successfully distinguish the systematic undulation by the exposed CP character profiles from random roughness components. Such capability of precise edge-roughness analysis is useful to our EBL methodology to maintain both the line-edge quality and the exposure throughput by optimizing the control parameters in the layout data conversion.

  19. Photon scanning tunneling microscope in combination with a force microscope

    NARCIS (Netherlands)

    Moers, M.H.P.; Moers, M.H.P.; Tack, R.G.; van Hulst, N.F.; Bölger, B.; Bölger, B.

    1994-01-01

    The simultaneous operation of a photon scanning tunneling microscope with an atomic force microscope is presented. The use of standard atomic force silicon nitride cantilevers as near-field optical probes offers the possibility to combine the two methods. Vertical forces and torsion are detected

  20. Emission characteristics of AuSiBe field ion sources

    Energy Technology Data Exchange (ETDEWEB)

    Drandarov, N.; Georgieva, St.; Nikolov, B.; Donchev, T. (Bylgarska Akademiya na Naukite, Sofia (Bulgaria). Inst. po Elektronika)

    A ribbon type AuSiBe alloy field ion source, which combines the advantages of both hairpin type sources and reservoir type sources, has been constructed. The current-voltage characteristics of this source have been investigated. Hysteresis and four differentiated emission regions have been observed for them. By means of scanning electronic microscopy, it has been established that this complicated behaviour of the I-V curves and the angular distribution of the extracted ions are associated with the shape of the emitting surface. The mass spectrum of the emitted ions has been determined by means of an E x B mass filter. Considerable emission of Au[sup +], AuBe[sub 3][sup 2+], Si[sup 2+], Be[sup 2+], AuBe[sub 3][sup +], Be[sup +], Si[sup +], and Au[sup 2+] has been observed. (author).

  1. The effects of two-dimensional bifurcations and quantum beats in a system of combined atomic force and scanning tunneling microscopes with quantum dots

    Science.gov (United States)

    Zhukovsky, V. Ch.; Krevchik, V. D.; Semenov, M. B.; Krevchik, P. V.; Zaytsev, R. V.; Egorov, I. A.

    2016-11-01

    The field and temperature dependence of the probability of two-dimensional dissipative tunneling is studied in the framework of one-instanton approximation for a model double-well oscillator potential in an external electric field at finite temperature with account for the influence of two local phonon modes for quantum dots in a system of a combined atomic force and a scanning tunneling microscope. It is demonstrated that in the mode of synchronous parallel transfer of tunneling particles from the cantilever tip to the quantum dot the two local phonon modes result in the occurrence of two stable peaks in the curve of the 2D dissipative tunneling probability as a function of the field. Qualitative comparison of the theoretical curve in the limit of weak dissociation and the experimental current-voltage characteristic for quantum dots that grow from colloidal gold under a cantilever tip at the initial stage of quantum-dot formation when the quantum dot size does not exceed 10 nm is performed. It is established that one of the two stable peaks that correspond to interaction of tunneling particles with two local phonon modes in the temperature dependence of the 2D dissipative tunneling probability can be split in two, which corresponds to the tunneling channel interference mechanism. It is found that the theoretically predicted and experimentally observed mode of quantum beats occurs near the bifurcation point.

  2. Effect of surface finishing on early-stage corrosion of a carbon steel studied by electrochemical and atomic force microscope characterizations

    Energy Technology Data Exchange (ETDEWEB)

    Li, Yuan; Cheng, Y. Frank, E-mail: fcheng@ucalgary.ca

    2016-03-15

    Graphical abstract: - Highlights: • Imaged the topography of steel with various surface roughness. • Monitored the early-stage corrosion of steel by AFM. • Derived the corrosion growth at nano-scale surface features. - Abstract: In this work, the early-stage corrosion of a carbon steel with various surface roughness, which was created by different levels of surface finishing treatment, was characterized by an atomic force microscope and electrochemical measurements. It is found that the resulting surface roughness is at nano-meter scale. As the surface roughness increases, the corrosion activity of the steel is increased. The early-stage corrosion of the steel is featured with two stages of dissolution. While the first stage involves a rapid dissolution and increasing surface roughness of the steel, stage two is in an equilibrium state to have an approximately constant corrosion rate and surface roughness. Generally, the corrosion rate of the steel decreases when the surface finish of the specimen becomes finer. Local preferential corrosion occurs at surface irregularities, resulting in the deepening and widening of the features such as scratches with time.

  3. Functionalization of undoped and p-doped Si (100) using atomic force microscope tips in the presence of propan-2-ol, butan-2-ol and toluene

    Science.gov (United States)

    McCausland, Jeffrey A.; Withanage, Sajeevi; Mallik, Robert R.; Lyuksyutov, Sergei F.

    2017-07-01

    A technique, based on amplitude modulation of Atomic Force Microscope (AFM) tips, in the absence of an applied bias voltage, is reported in this study. Under ambient humidity conditions, ultra-sharp n-doped silicon tips (spike radius 1 nm) oscillating at 160-250 kHz generate raised nanostructures 50-200 nm wide and 2 nm high on undoped or p-doped Si (100) surfaces pretreated with certain neat organic solvents. The solvents in the present work are propan-2-ol, butan-2-ol, or toluene. AFM is used to characterize the nanostructures which are found to be stable for at least 96 h. It is suggested that mechanical stress associated with the oscillatory Hookean energy ( 5-15 eV) of the tip promotes cleavage of residual solvent bonds on the surface. This bond cleavage, and the presence of surface defects, which may be critical in the formation of surface-solvent bonds (specifically Si-O-C or Si-C) to create the observed nanostructures, is discussed. The process described here to create raised nanostructures is distinctly different from all other reported techniques to date.

  4. Combined Atomic Force Microscope-Based Topographical Imaging and Nanometer Scale Resolved Proximal Probe Thermal Desorption/Electrospray Ionization-Mass Spectrometry

    Energy Technology Data Exchange (ETDEWEB)

    Ovchinnikova, Olga S [ORNL; Nikiforov, Maxim [ORNL; Bradshaw, James A [ORNL; Jesse, Stephen [ORNL; Van Berkel, Gary J [ORNL

    2011-01-01

    Nanometer scale proximal probe thermal desorption/electrospray ionization mass spectrometry (TD/ESI-MS) was demonstrated for molecular surface sampling of caffeine from a thin film using a 30 nm diameter nano-thermal analysis (nano-TA) probe tip in an atomic force microscope (AFM) coupled via a vapor transfer line and ESI interface to a MS detection platform. Using a probe temperature of 350 C and a spot sampling time of 30 s, conical desorption craters 250 nm in diameter and 100 nm deep were created as shown through subsequent topographical imaging of the surface within the same system. Automated sampling of a 5 x 2 array of spots, with 2 m spacing between spots, and real time selective detection of the desorbed caffeine using tandem mass spectrometry was also demonstrated. Estimated from the crater volume (~2x106 nm3), only about 10 amol (2 fg) of caffeine was liberated from each thermal desorption crater in the thin film. These results illustrate a relatively simple experimental setup and means to acquire in automated fashion sub-micrometer scale spatial sampling resolution and mass spectral detection of materials amenable to TD. The ability to achieve MS-based chemical imaging with 250 nm scale spatial resolution with this system is anticipated.

  5. Atomic-Resolution Transmission Electron Microscopic Movies for Study of Organic Molecules, Assemblies, and Reactions: The First 10 Years of Development.

    Science.gov (United States)

    Nakamura, Eiichi

    2017-06-20

    A molecule is a quantum mechanical entity. "Watching motions and reactions of a molecule with our eyes" has therefore been a dream of chemists for a century. This dream has come true with the aid of the movies of atomic-resolution transmission electron microscopic (AR-TEM) molecular images through real-time observation of dynamic motions of single organic molecules (denoted hereafter as single-molecule atomic-resolution real-time (SMART) TEM imaging). Since 2007, we have reported movies of a variety of single organic molecules, organometallic molecules, and their assemblies, which are rotating, stretching, and reacting. Like movies in the theater, the atomic-resolution molecular movies provide us information on the 3-D structures of the molecules and also their time evolution. The success of the SMART-TEM imaging crucially depends on the development of "chemical fishhooks" with which fish (organic molecules) in solution can be captured on a single-walled carbon nanotube (CNT, serving as a "fishing rod"). The captured molecules are connected to a slowly vibrating CNT, and their motions are displayed on a monitor in real time. A "fishing line" connecting the fish and the rod may be a σ-bond, a van der Waals force, or other weak connections. Here, the molecule/CNT system behaves as a coupled oscillator, where the low-frequency anisotropic vibration of the CNT is transmitted to the molecules via the weak chemical connections that act as an energy filter. Interpretation of the observed motions of the molecules at atomic resolution needs us to consider the quantum mechanical nature of electrons as well as bond rotation, letting us deviate from the conventional statistical world of chemistry. What new horizons can we explore? We have so far carried out conformational studies of individual molecules, assigning anti or gauche conformations to each C-C bond in conformers that we saw. We can also determine the structures of van der Waals assemblies of organic molecules

  6. Analyzing the Effect of Capillary Force on Vibrational Performance of the Cantilever of an Atomic Force Microscope in Tapping Mode with Double Piezoelectric Layers in an Air Environment.

    Science.gov (United States)

    Nahavandi, Amir; Korayem, Moharam Habibnejad

    2015-10-01

    The aim of this paper is to determine the effects of forces exerted on the cantilever probe tip of an atomic force microscope (AFM). These forces vary according to the separation distance between the probe tip and the surface of the sample being examined. Hence, at a distance away from the surface (farther than d(on)), these forces have an attractive nature and are of Van der Waals type, and when the probe tip is situated in the range of a₀≤ d(ts) ≤ d(on), the capillary force is added to the Van der Waals force. At a distance of d(ts) ≤ a₀, the Van der Waals and capillary forces remain constant at intermolecular distances, and the contact repulsive force repels the probe tip from the surface of sample. The capillary force emerges due to the contact of thin water films with a thickness of h(c) which have accumulated on the sample and probe. Under environmental conditions a layer of water or hydrocarbon often forms between the probe tip and sample. The capillary meniscus can grow until the rate of evaporation equals the rate of condensation. For each of the above forces, different models are presented. The smoothness or roughness of the surfaces and the geometry of the cantilever tip have a significant effect on the modeling of forces applied on the probe tip. Van der Waals and the repulsive forces are considered to be the same in all the simulations, and only the capillary force is altered in order to evaluate the role of this force in the AFM-based modeling. Therefore, in view of the remarkable advantages of the piezoelectric microcantilever and also the extensive applications of the tapping mode, we investigate vibrational motion of the piezoelectric microcantilever in the tapping mode. The cantilever mentioned is entirely covered by two piezoelectric layers that carry out both the actuation of the probe tip and the measuringof its position.

  7. Leptospiral outer membrane lipoprotein LipL32 binding on toll-like receptor 2 of renal cells as determined with an atomic force microscope.

    Science.gov (United States)

    Hsu, Shen-Hsing; Lo, Yueh-Yu; Tung, Jung-Yu; Ko, Yi-Ching; Sun, Yuh-Ju; Hung, Cheng-Chieh; Yang, Chih-Wei; Tseng, Fan-Gang; Fu, Chien-Chung; Pan, Rong-Long

    2010-07-06

    Leptopirosis is a renal disease caused by pathogenic Leptospira that primarily infects the renal proximal tubules, consequently resulting in severe tubular injuries and malfunctions. The protein extracted from the outer membrane of this pathogenic strain contains a major component of a 32 kDa lipoprotein (LipL32), which is absent in the counter membrane of nonpathogenic strains and has been identified as a crucial factor for host cell infection. Previous studies showed that LipL32 induced inflammatory responses and interacted with the extracellular matrix (ECM) of the host cell. However, the exact relationship between LipL32-mediated inflammatory responses and ECM binding is still unknown. In this study, an atomic force microscope with its tip modified by purified LipL32 was used to assess the interaction between LipL32 and cell surface receptors. Furthermore, an antibody neutralization technique was employed to identify Toll-like receptor 2 (TLR2) but not TLR4 as the major target of LipL32 attack. The interaction force between LipL32 and TLR2 was measured as approximately 59.5 +/- 8.7 pN, concurring with the theoretical value for a single-pair molecular interaction. Moreover, transformation of a TLR deficient cell line with human TLR2 brought the interaction force from the basal level to approximately 60.4 +/- 11.5 pN, confirming unambiguously TLR2 as counter receptor for LipL32. The stimulation of CXCL8/IL-8 expression by full-length LipL32 as compared to that without the N-terminal signal peptide domain suggests a significant role of the signal peptide of the protein in the inflammatory responses. This study provides direct evidence that LipL32 binds to TLR2, but not TLR4, on the cell surface, and a possible mechanism for the virulence of leptospirosis is accordingly proposed.

  8. Kr II and Xe II axial velocity distribution functions in a cross-field ion source

    Science.gov (United States)

    Lejeune, A.; Bourgeois, G.; Mazouffre, S.

    2012-07-01

    Laser induced fluorescence measurements were carried out in a cross-field ion source to examine the behaviour of the axial ion velocity distribution functions (VDFs) in the expanding plasma. In the present paper, we focus on the axial VDFs of Kr II and Xe II ions. We examine the contourplots in a 1D-phase space (x,vx) representation in front of the exhaust channel and along the centerline of the ion source. The main ion beam, whose momentum corresponds to the ions that are accelerated through the whole potential drop, is observed. A secondary structure reveals the ions coming from the opposite side of the channel. We show that the formation of the neutralized ion flow is governed by the annular geometry. The assumption of a collisionless shock or a double layer due to supersonic beam interaction is not necessary. A non-negligible fraction of slow ions originates in local ionization or charge-exchange collision events between ions of the expanding plasma and atoms of the background residual gas. Slow ions that are produced near the centerline in the vicinity of the exit plane are accelerated toward the source body with a negative velocity leading to a high sputtering of front face. On the contrary, the ions that are produced in the vicinity of the channel exit plane are partially accelerated by the extended electric field.

  9. Surface imaging microscope

    Science.gov (United States)

    Rogala, Eric W.; Bankman, Isaac N.

    2008-04-01

    The three-dimensional shapes of microscopic objects are becoming increasingly important for battlespace CBRNE sensing. Potential applications of microscopic 3D shape observations include characterization of biological weapon particles and manufacturing of micromechanical components. Aerosol signatures of stand-off lidar systems, using elastic backscatter or polarization, are dictated by the aerosol particle shapes and sizes that must be well characterized in the lab. A low-cost, fast instrument for 3D surface shape microscopy will be a valuable point sensor for biological particle sensing applications. Both the cost and imaging durations of traditional techniques such as confocal microscopes, atomic force microscopes, and electron scanning microscopes are too high. We investigated the feasibility of a low-cost, fast interferometric technique for imaging the 3D surface shape of microscopic objects at frame rates limited only by the camera in the system. The system operates at two laser wavelengths producing two fringe images collected simultaneously by a digital camera, and a specialized algorithm we developed reconstructs the surface map of the microscopic object. The current implementation assembled to test the concept and develop the new 3D reconstruction algorithm has 0.25 micron resolution in the x and y directions, and about 0.1 micron accuracy in the z direction, as tested on a microscopic glass test object manufactured with etching techniques. We describe the interferometric instrument, present the reconstruction algorithm, and discuss further development.

  10. Microscope basics.

    Science.gov (United States)

    Sluder, Greenfield; Nordberg, Joshua J

    2013-01-01

    This chapter provides information on how microscopes work and discusses some of the microscope issues to be considered in using a video camera on the microscope. There are two types of microscopes in use today for research in cell biology-the older finite tube-length (typically 160mm mechanical tube length) microscopes and the infinity optics microscopes that are now produced. The objective lens forms a magnified, real image of the specimen at a specific distance from the objective known as the intermediate image plane. All objectives are designed to be used with the specimen at a defined distance from the front lens element of the objective (the working distance) so that the image formed is located at a specific location in the microscope. Infinity optics microscopes differ from the finite tube-length microscopes in that the objectives are designed to project the image of the specimen to infinity and do not, on their own, form a real image of the specimen. Three types of objectives are in common use today-plan achromats, plan apochromats, and plan fluorite lenses. The concept of mounting video cameras on the microscope is also presented in the chapter. Copyright © 2003 Elsevier Inc. All rights reserved.

  11. Microwave Microscope

    Data.gov (United States)

    Federal Laboratory Consortium — FUNCTION: Makes ultra-high-resolution field measurements. The Microwave Microscope (MWM) has been used in support of several NRL experimental programs involving sea...

  12. Biprism Electron Interferometry with a Single Atom Tip Source

    CERN Document Server

    Schütz, Georg; Pooch, Andreas; Meier, Simon; Schneeweiss, Philipp; Rauschenbeutel, Arno; Günther, Andreas; Chang, Wei-Tse; Hwang, Ing-Shouh; Stibor, Alexander

    2013-01-01

    Experiments with electron or ion matter waves require a coherent, monochromatic and long-term stable source with high brightness. These requirements are best fulfilled by single atom tip (SAT) field emitters. The performance of an iridium covered W(111) SAT is demonstrated and analyzed for electrons in a biprism interferometer. Furthermore we characterize the emission of the SAT in a separate field electron and field ion microscope and compare it with other emitter types. A new method is presented to fabricate the electrostatic charged biprism wire that separates and combines the matter wave. In contrast to other biprism interferometers the source and the biprism size are well defined within a few nanometers. The setup has direct applications in ion interferometry and Aharonov-Bohm physics.

  13. Atomic-resolution studies of In{sub 2}O{sub 3}-ZnO compounds on aberration-corrected electron microscopes

    Energy Technology Data Exchange (ETDEWEB)

    Yu, Wentao

    2009-10-23

    In this work, the characteristic inversion domain microstructures of In{sub 2}O{sub 3}(ZnO){sub m} (m=30) compounds were investigated by TEM methods. At bright-atom contrast condition, atomically resolved HR-TEM images of In{sub 2}O{sub 3}(ZnO){sub 30} were successfully acquired in [1 anti 100] zone axis of ZnO, with projected metal columns of {proportional_to}1.6 A well resolved. From contrast maxima in the TEM images, local lattice distortions at the pyramidal inversion domain boundaries were observed for the first time. Lattice displacements and the strain field in two-dimensions were visualized and measured using the 'DALI' algorithm. Atomically resolved single shot and focal series images of In{sub 2}O{sub 3}(ZnO){sub 30} were achieved in both zone axes of ZnO, [1 anti 100] and [2 anti 1 anti 10], respectively. The electron waves at the exit-plane were successfully reconstructed using the software package 'TrueImage'. Finally, a three dimensional atomic structure model for the pyramidal IDB was proposed, with an In distribution of 10%, 20%, 40%, 20% and 10% of In contents over 5 atom columns along basal planes, respectively. Through a detailed structural study of In{sub 2}O{sub 3}(ZnO){sub m} compounds by using phase-contrast and Z-contrast imaging at atomic resolution, In{sup 3+} atoms are determined with trigonal bi-pyramidal co-ordination and are distributed at the pyramidal IDBs. (orig.)

  14. Generation of One-Dimensional Array of Focused Hollow-Beam Pipes and Its Surface Microscopic Waveguide for Cold Atoms or Molecules

    Institute of Scientific and Technical Information of China (English)

    JI Xian-Ming; XIA Yong; YIN Jian-Ping

    2004-01-01

    We propose a new scheme to guide cold atoms (or molecules) by using a one-dimensional (1D) array of focused hollow-beam pipes generated by the combination of a binary phase grating and a 1D array of micro-cylindrical lenses on the substrate surface. We also calculate the intensity distribution of the focused hollow-beam pipe array and its optical potential for 85Rb atoms. The result shows that when the blue detuning of the incident beam and its intensity are 10 GHz and 7.0 × 103 W/m2 respectively, the horizontal dark spot size of each focused hollow-beam pipe and the efficient optical potential are 4.4μm and ~ 0.23mK, which is high enough to guide cold 85Rb atoms (~ 20 μK) from a standard optical molasses and then to realize the 1D array of surface atomic waveguides on an atom chip.

  15. Electron Microscope Center Opens at Berkeley.

    Science.gov (United States)

    Robinson, Arthur L.

    1981-01-01

    A 1.5-MeV High Voltage Electron Microscope has been installed at the Lawrence Berkeley Laboratory which will help materials scientists and biologists study samples in more true-to-life situations. A 1-MeV Atomic Resolution Microscope will be installed at the same location in two years which will allow scientists to distinguish atoms. (DS)

  16. A Student-Built Scanning Tunneling Microscope

    Science.gov (United States)

    Ekkens, Tom

    2015-01-01

    Many introductory and nanotechnology textbooks discuss the operation of various microscopes including atomic force (AFM), scanning tunneling (STM), and scanning electron microscopes (SEM). In a nanotechnology laboratory class, students frequently utilize microscopes to obtain data without a thought about the detailed operation of the tool itself.…

  17. A Student-Built Scanning Tunneling Microscope

    Science.gov (United States)

    Ekkens, Tom

    2015-01-01

    Many introductory and nanotechnology textbooks discuss the operation of various microscopes including atomic force (AFM), scanning tunneling (STM), and scanning electron microscopes (SEM). In a nanotechnology laboratory class, students frequently utilize microscopes to obtain data without a thought about the detailed operation of the tool itself.…

  18. Effect of 16% Carbamide Peroxide Bleaching Gel on Enamel and Dentin Surface Micromorphology and Roughness of Uremic Patients: An Atomic Force Microscopic Study

    OpenAIRE

    2010-01-01

    Objectives: To investigate the effect of 16% carbamide peroxide bleaching gel on surface micromorphology and roughness of enamel and root dentin of uremic patients receiving hemodialysis using atomic force microscopy (AFM). Methods: A total of 20 sound molars were collected from healthy individuals (n=10) and uremic patients (n=10). The roots were separated from their crowns at the cemento-enamel junction. Dental slabs (3 mm x 2 mm x 2 mm) were obtained from the buccal surface for enamel slab...

  19. Martian Microscope

    Science.gov (United States)

    2004-01-01

    The microscopic imager (circular device in center) is in clear view above the surface at Meridiani Planum, Mars, in this approximate true-color image taken by the panoramic camera on the Mars Exploration Rover Opportunity. The image was taken on the 9th sol of the rover's journey. The microscopic imager is located on the rover's instrument deployment device, or arm. The arrow is pointing to the lens of the instrument. Note the dust cover, which flips out to the left of the lens, is open. This approximated color image was created using the camera's violet and infrared filters as blue and red.

  20. Microscopic colitis

    DEFF Research Database (Denmark)

    Münch, A; Aust, D; Bohr, Jakob

    2012-01-01

    Microscopic colitis (MC) is an inflammatory bowel disease presenting with chronic, non-bloody watery diarrhoea and few or no endoscopic abnormalities. The histological examination reveals mainly two subtypes of MC, lymphocytic or collagenous colitis. Despite the fact that the incidence in MC has...... been rising over the last decades, research has been sparse and our knowledge about MC remains limited. Specialists in the field have initiated the European Microscopic Colitis Group (EMCG) with the primary goal to create awareness on MC. The EMCG is furthermore a forum with the intention to promote...

  1. Martian Microscope

    Science.gov (United States)

    2004-01-01

    The microscopic imager (circular device in center) is in clear view above the surface at Meridiani Planum, Mars, in this approximate true-color image taken by the panoramic camera on the Mars Exploration Rover Opportunity. The image was taken on the 9th sol of the rover's journey. The microscopic imager is located on the rover's instrument deployment device, or arm. The arrow is pointing to the lens of the instrument. Note the dust cover, which flips out to the left of the lens, is open. This approximated color image was created using the camera's violet and infrared filters as blue and red.

  2. Exploration of Comparison Method in Application to Atomic Force Microscope Instrument Teaching%比较教学法应用于原子力显微镜仪器教学的探索

    Institute of Scientific and Technical Information of China (English)

    祝向荣; 许中平; 黎阳; 朱志刚; 于伟; 谢华清

    2016-01-01

    As one kind of widely used instruments for characterizing nanoscale structures of materials, atomic force microscope (AFM) has been listed as the practice course of material major by many technique universities. In this paper, comparison method is explored and practiced in AFM course teaching. Graphene, one research focus in modern materials field, is used as the comparison teaching object. Three types of comparisons are made. The first is the comparison of the AFM morphologies between the oxide graphene and the large sheet of graphene. The second is the comparison of the AFM morphology and scanning electronic microscope (SEM) mor-phology of the grapheme samples. The third is the comparison of the AFM morphologies of oxide graphene obtained under different experiment conditions. By conducting these comparisons, the students would well understand the principle and function of AFM. Their AFM operating skills could also be enhanced. Additionally, they could obtain more intuitionistic knowledge about the micro-structure characteristics of graphene.%原子力显微镜(Atomic Force Microscope, AFM)作为一种广泛使用的材料纳米尺度微结构表征仪器,已列入许多理工科大学材料相关专业的仪器教学课程。利用比较教学法在AFM仪器教学中的应用进行了探索和实践。以材料科学研究热点对象石墨烯的微结构表征为例,在教学过程中,比较了氧化石墨烯和大片多层石墨烯的AFM形貌特征,氧化石墨烯和多层石墨烯的AFM成像和扫描电子显微镜(Scanning Electronic Microscope, SEM)成像特征,以及不同实验条件下氧化石墨烯的AFM成像形貌。通过这些比较教学内容,使学生对AFM仪器的工作原理和功能有了更深入的理解和掌握, AFM仪器的操作技能也得到了提升,并且对石墨烯材料的微结构特征有了更直观的了解。

  3. Microscopic colitis.

    Science.gov (United States)

    Ianiro, Gianluca; Cammarota, Giovanni; Valerio, Luca; Annicchiarico, Brigida Eleonora; Milani, Alessandro; Siciliano, Massimo; Gasbarrini, Antonio

    2012-11-21

    Microscopic colitis may be defined as a clinical syndrome, of unknown etiology, consisting of chronic watery diarrhea, with no alterations in the large bowel at the endoscopic and radiologic evaluation. Therefore, a definitive diagnosis is only possible by histological analysis. The epidemiological impact of this disease has become increasingly clear in the last years, with most data coming from Western countries. Microscopic colitis includes two histological subtypes [collagenous colitis (CC) and lymphocytic colitis (LC)] with no differences in clinical presentation and management. Collagenous colitis is characterized by a thickening of the subepithelial collagen layer that is absent in LC. The main feature of LC is an increase of the density of intra-epithelial lymphocytes in the surface epithelium. A number of pathogenetic theories have been proposed over the years, involving the role of luminal agents, autoimmunity, eosinophils, genetics (human leukocyte antigen), biliary acids, infections, alterations of pericryptal fibroblasts, and drug intake; drugs like ticlopidine, carbamazepine or ranitidine are especially associated with the development of LC, while CC is more frequently linked to cimetidine, non-steroidal antiinflammatory drugs and lansoprazole. Microscopic colitis typically presents as chronic or intermittent watery diarrhea, that may be accompanied by symptoms such as abdominal pain, weight loss and incontinence. Recent evidence has added new pharmacological options for the treatment of microscopic colitis: the role of steroidal therapy, especially oral budesonide, has gained relevance, as well as immunosuppressive agents such as azathioprine and 6-mercaptopurine. The use of anti-tumor necrosis factor-α agents, infliximab and adalimumab, constitutes a new, interesting tool for the treatment of microscopic colitis, but larger, adequately designed studies are needed to confirm existing data.

  4. Microscopic colitis

    Institute of Scientific and Technical Information of China (English)

    Gianluca Ianiro; Giovanni Cammarota; Luca Valerio; Brigida Eleonora Annicchiarico; Alessandro Milani; Massimo Siciliano; Antonio Gasbarrini

    2012-01-01

    Microscopic colitis may be defined as a clinical syndrome,of unknown etiology,consisting of chronic watery diarrhea,with no alterations in the large bowel at the endoscopic and radiologic evaluation.Therefore,a definitive diagnosis is only possible by histological analysis.The epidemiological impact of this disease has become increasingly clear in the last years,with most data coming from Western countries.Microscopic colitis includes two histological subtypes [collagenous colitis (CC) and lymphocytic colitis (LC)] with no differences in clinical presentation and management.Collagenous colitis is characterized by a thickening of the subepithelial collagen layer that is absent in LC.The main feature of LC is an increase of the density of intra-epitll lial lymphocytes in the surface epithelium.A number of pathogenetic theories have been proposed over the years,involving the role of luminal agents,autoimmunity,eosinophils,genetics (human leukocyte antigen),biliary acids,infections,alterations of pericryptal fibroblasts,and drug intake; drugs like ticlopidine,carbamazepine or ranitidine are especially associated with the development of LC,while CC is more frequently linked to cimetidine,non-steroidal antiinflammatory drugs and lansoprazole.Microscopic colitis typically presents as chronic or intermittent watery diarrhea,that may be accompanied by symptoms such as abdominal pain,weight loss and incontinence.Recent evidence has added new pharmacological options for the treatment of microscopic colitis:the role of steroidal therapy,especially oral budesonide,has gained relevance,as well as immunosuppressive agents such as azathioprine and 6-mercaptopurine.The use of anti-tumor necrosis factor-α agents,infliximab and adalimumab,constitutes a new,interesting tool for the treatment of microscopic colitis,but larger,adequately designed studies are needed to confirm existing data.

  5. A first-principles investigation on microscopic atom distribution and configuration-averaged properties in Cd(1-x)Zn(x)S solid solutions.

    Science.gov (United States)

    Zhou, Zhaohui; Shi, Jinwen; Wu, Po; Guo, Liejin

    2014-10-06

    The structural, energetic, and electronic properties of zincblende and wurtzite phase Cd(1-x)Zn(x)S (0≤x≤1) solid solutions were investigated by first-principles calculations. It was revealed that the trend of atom distribution in configurations with the same x value can be quantitatively characterized by the average length of the Zn-S bonds. The origin of this trend was attributed to the strong interaction of the Zn-S bonds, which acted against the aggregation of Zn atoms in this solid solution. By using a configuration-averaged method, structural and energetic properties were estimated as a function of Zn content at the level of the generalized gradient approximation, whereas electronic properties were corrected by using a hybrid functional. Phase diagrams of both solid solutions were established. An optimal x value of approximately 0.5 for photocatalytic hydrogen production was determined by taking both the band edges and band gaps into consideration; this conclusion was supported by the results of a variety of experiments.

  6. Characterization of surface modification in atomic force microscope-induced nanolithography of oxygen deficient La0.67Ba0.33MnO3−δ thin films

    Directory of Open Access Journals (Sweden)

    E. Kevin Tanyi

    2014-12-01

    Full Text Available We report our studies of the nanolithographic surface modifications induced by an Atomic Force Microscope (AFM in epitaxial thin films of oxygen deficient Lanthanum Barium Manganese Oxide (La0.67Ba0.33MnO3−δ. The pattern characteristics depend on the tip voltage, tip polarity, voltage duration, tip force, and humidity. We have used Electron Energy Dispersive X-Ray Spectroscopy (EDS to analyze the chemical changes associated with the surface modifications produced with a negatively biased AFM tip. A significant increase in the oxygen stoichiometry for the patterned regions relative to the pristine film surface is observed. The results also indicate changes in the cation stoichiometry, specifically a decrease in the Lanthanum and Manganese concentrations and an increase in the Barium concentration in the patterned regions.

  7. Nanoscale infrared (IR) spectroscopy and imaging of structural lipids in human stratum corneum using an atomic force microscope to directly detect absorbed light from a tunable IR laser source.

    Science.gov (United States)

    Marcott, Curtis; Lo, Michael; Kjoller, Kevin; Domanov, Yegor; Balooch, Guive; Luengo, Gustavo S

    2013-06-01

    An atomic force microscope (AFM) and a tunable infrared (IR) laser source have been combined in a single instrument (AFM-IR) capable of producing ~200-nm spatial resolution IR spectra and absorption images. This new capability enables IR spectroscopic characterization of human stratum corneum at unprecendented levels. Samples of normal and delipidized stratum corneum were embedded, cross-sectioned and mounted on ZnSe prisms. A pulsed tunable IR laser source produces thermomechanical expansion upon absorption, which is detected through excitation of contact resonance modes in the AFM cantilever. In addition to reducing the total lipid content, the delipidization process damages the stratum corneum morphological structure. The delipidized stratum corneum shows substantially less long-chain CH2 -stretching IR absorption band intensity than normal skin. AFM-IR images that compare absorbances at 2930/cm (lipid) and 3290/cm (keratin) suggest that regions of higher lipid concentration are located at the perimeter of corneocytes in the normal stratum corneum.

  8. Exploring the retention properties of CaF2 nanoparticles as possible additives for dental care application with tapping-mode atomic force microscope in liquid

    Directory of Open Access Journals (Sweden)

    Matthias Wasem

    2014-01-01

    Full Text Available Amplitude-modulation atomic force microscopy (AM-AFM is used to determine the retention properties of CaF2 nanoparticles adsorbed on mica and on tooth enamel in liquid. From the phase-lag of the forced cantilever oscillation the local energy dissipation at the detachment point of the nanoparticle was determined. This enabled us to compare different as-synthesized CaF2 nanoparticles that vary in shape, size and surface structure. CaF2 nanoparticles are candidates for additives in dental care products as they could serve as fluorine-releasing containers preventing caries during a cariogenic acid attack on the teeth. We show that the adherence of the nanoparticles is increased on the enamel substrate compared to mica, independently of the substrate roughness, morphology and size of the particles.

  9. The relationship between local liquid density and force applied on a tip of atomic force microscope: A theoretical analysis for simple liquids

    Energy Technology Data Exchange (ETDEWEB)

    Amano, Ken-ichi, E-mail: aman@tohoku-pharm.ac.jp; Takahashi, Ohgi [Faculty of Pharmaceutical Sciences, Tohoku Pharmaceutical University, 4-4-1 Komatsushima, Aoba-ku, Sendai 981-8558 (Japan); Suzuki, Kazuhiro [Department of Electronic Science and Engineering, Kyoto University, Katsura, Nishikyo, Kyoto 615-8510 (Japan); Fukuma, Takeshi [Bio-AFM Frontier Research Center, Kanazawa University, Kakuma-machi, Kanazawa 920-1192 (Japan); Onishi, Hiroshi [Department of Chemistry, Faculty of Science, Kobe University, Nada-ku, Kobe 657-8501 (Japan)

    2013-12-14

    The density of a liquid is not uniform when placed on a solid. The structured liquid pushes or pulls a probe employed in atomic force microscopy, as demonstrated in a number of experimental studies. In the present study, the relation between the force on a probe and the local density of a liquid is derived based on the statistical mechanics of simple liquids. When the probe is identical to a solvent molecule, the strength of the force is shown to be proportional to the vertical gradient of ln(ρ{sub DS}) with the local liquid's density on a solid surface being ρ{sub DS}. The intrinsic liquid's density on a solid is numerically calculated and compared with the density reconstructed from the force on a probe that is identical or not identical to the solvent molecule.

  10. Femtosecond scanning tunneling microscope

    Energy Technology Data Exchange (ETDEWEB)

    Taylor, A.J.; Donati, G.P.; Rodriguez, G.; Gosnell, T.R.; Trugman, S.A.; Some, D.I.

    1998-11-01

    This is the final report of a three-year, Laboratory Directed Research and Development (LDRD) project at the Los Alamos National Laboratory (LANL). By combining scanning tunneling microscopy with ultrafast optical techniques we have developed a novel tool to probe phenomena on atomic time and length scales. We have built and characterized an ultrafast scanning tunneling microscope in terms of temporal resolution, sensitivity and dynamic range. Using a novel photoconductive low-temperature-grown GaAs tip, we have achieved a temporal resolution of 1.5 picoseconds and a spatial resolution of 10 nanometers. This scanning tunneling microscope has both cryogenic and ultra-high vacuum capabilities, enabling the study of a wide range of important scientific problems.

  11. Stage II recovery behavior of a series of ion-irradiated platinum (gold) alloys as studied by field-ion microscopy. [0. 10, 0. 62, and 4. 0 at. percent Au and pure Pt

    Energy Technology Data Exchange (ETDEWEB)

    Wei, C.Y.; Seidman, D.N.

    1976-11-01

    Direct and visible evidence was obtained for long-range migration of self-interstitial atoms (SIAs) in Stage II of three different ion-irradiated platinum (gold) alloys. Field-ion microscope (FIM) specimens of Pt--0.10, 0.62 and 4.0 at. percent Au alloys were irradiated in-situ with 30-keV W/sup +/ or Pt/sup +/ ions at a tip temperature of 35 to 41 K at 2 x 10/sup -9/ torr. Direct observation of the surfaces of the FIM specimens during isochronal warming experiments to 100 K showed that a flux of SIAs crossed the surfaces of the specimens between 40 to 100 K. The spectrum for each alloy consisted of two recovery peaks (substages II/sub B/ and II/sub C/). The results are explained on the basis of an impurity-delayed diffusion mechanism employing a two-level trapping model. The application of this diffusion model to the isochronal recovery spectra yielded a dissociation enthalpy (DELTAh/sub li-Au//sup diss/) and an effective diffusion coefficient for each substage; for substage II/sub B/ DELTAh/sub li-Au//sup diss/ (II/sub B/) = 0.15 eV and for substage II/sub C/ DELTAh/sub li-Au//sup diss/ (II/sub C/) = 0.24 eV. A series of detailed control experiments was also performed to show that the imaging electric field had not caused the observed long-range migration of SIAs and that the observed effects were not the result of surface artifacts. 14 figures, 6 tables.

  12. Observation of Switchable Photoresponse of a Monolayer WSe 2 –MoS 2 Lateral Heterostructure via Photocurrent Spectral Atomic Force Microscopic Imaging

    KAUST Repository

    Son, Youngwoo

    2016-04-27

    In the pursuit of two-dimensional (2D) materials beyond graphene, enormous advances have been made in exploring the exciting and useful properties of transition metal dichalcogenides (TMDCs), such as a permanent band gap in the visible range and the transition from indirect to direct band gap due to 2D quantum confinement, and their potential for a wide range of device applications. In particular, recent success in the synthesis of seamless monolayer lateral heterostructures of different TMDCs via chemical vapor deposition methods has provided an effective solution to producing an in-plane p-n junction, which is a critical component in electronic and optoelectronic device applications. However, spatial variation of the electronic and optoelectonic properties of the synthesized heterojunction crystals throughout the homogeneous as well as the lateral junction region and the charge carrier transport behavior at their nanoscale junctions with metals remain unaddressed. In this work, we use photocurrent spectral atomic force microscopy to image the current and photocurrent generated between a biased PtIr tip and a monolayer WSe2-MoS2 lateral heterostructure. Current measurements in the dark in both forward and reverse bias reveal an opposite characteristic diode behavior for WSe2 and MoS2, owing to the formation of a Schottky barrier of dissimilar properties. Notably, by changing the polarity and magnitude of the tip voltage applied, pixels that show the photoresponse of the heterostructure are observed to be selectively switched on and off, allowing for the realization of a hyper-resolution array of the switchable photodiode pixels. This experimental approach has significant implications toward the development of novel optoelectronic technologies for regioselective photodetection and imaging at nanoscale resolutions. Comparative 2D Fourier analysis of physical height and current images shows high spatial frequency variations in substrate/MoS2 (or WSe2) contact that

  13. Analyzing the effect of the forces exerted on cantilever probe tip of atomic force microscope with tapering-shaped geometry and double piezoelectric extended layers in the air and liquid environments

    Science.gov (United States)

    Korayem, Moharam Habibnejad; Nahavandi, Amir

    2017-01-01

    The aim of the present study is to assess the force vibrational performance of tapering-shaped cantilevers, using Euler-Bernoulli theory. Tapering-shaped cantilevers have plan-view geometry consisting of a rectangular section at the clamped end and a triangular section at the tip. Hamilton's principle is utilized to obtain the partial differential equations governing the nonlinear vibration of the system as well as the corresponding boundary conditions. In this model, a micro cantilever, which is covered by two piezoelectric layers at the top and the bottom, is modeled at angle α. Both of these layers are subjected to similar AC and DC voltages. This paper attempts to determine the effect of the capillary force exerted on the cantilever probe tip of an atomic force microscope. The capillary force emerges due to the contact between thin water films with a thickness of hc which have accumulated on the sample and the probe. In addition, an attempt is made to develop the capillary force between the tip and the sample surface with respect to the geometry obtained. The smoothness or the roughness of the surfaces as well as the geometry of the cantilever tip have significant effects on the modeling of forces applied to the probe tip. In this article, the Van der Waals and the repulsive forces are considered to be the same in all of the simulations, and only is the capillary force altered in order to evaluate the role of this force in the atomic force microscope based modeling. We also indicate that the tip shape and the radial distance of the meniscus greatly influence the capillary force. The other objective of our study is to draw a comparison between tapering-and rectangular-shaped cantilevers. Furthermore, the equation for converting the tip of a tapering-shaped cantilever into a rectangular cantilever is provided. Moreover, the modal analysis method is employed to solve the motion equation. The mode shape function for the two tapering-shaped sections of the first

  14. Uncovering the microscopic mechanism of strand exchange during RecA mediated homologous recombination using all-atom molecular dynamics simulations

    Science.gov (United States)

    Shankla, Manish; Yoo, Jejoong; Aksimentiev, Aleksei

    2012-02-01

    Homologous recombination (HR) is a key step during the repair process of double-stranded DNA (dsDNA) breakage. RecA is a protein that mediates HR in bacteria. RecA monomers polymerize on a single-stranded DNA (ssDNA) separated from the broken dsDNA to form a helical filament, thus allowing strand exchange to occur. Recent crystal structures depict each RecA monomer in contact with three contiguous nucleotides called DNA triplets. Surprisingly, the conformation of each triplet is similar to that of a triplet in B-form DNA. However, in the filament the neighboring triplets are separated by loops of the RecA proteins. Single molecule experiments demonstrated that strand exchange propagation occurs in 3 base-pair increments. However, the temporal resolution of the experiments was insufficient to determine the exact molecular mechanism of the triplet propagation. Using all-atom molecular dynamics simulations, we investigated the effect of both the RecA protein and the conformation of the bound ssDNA fragment on the stability of the duplex DNA intermediate formed during the strand-exchange process. Specifically, we report simulations of force-induced unzipping of duplex DNA in the presence and absence of the RecA filament that explored the effect of the triplet ladder conformation.

  15. The role of surface corrugation and tip oscillation in single-molecule manipulation with a non-contact atomic force microscope

    Directory of Open Access Journals (Sweden)

    Christian Wagner

    2014-02-01

    Full Text Available Scanning probe microscopy (SPM plays an important role in the investigation of molecular adsorption. The possibility to probe the molecule–surface interaction while tuning its strength through SPM tip-induced single-molecule manipulation has particularly promising potential to yield new insights. We recently reported experiments, in which 3,4,9,10-perylene-tetracarboxylic-dianhydride (PTCDA molecules were lifted with a qPlus-sensor and analyzed these experiments by using force-field simulations. Irrespective of the good agreement between the experiment and those simulations, systematic inconsistencies remained that we attribute to effects omitted from the initial model. Here we develop a more realistic simulation of single-molecule manipulation by non-contact AFM that includes the atomic surface corrugation, the tip elasticity, and the tip oscillation amplitude. In short, we simulate a full tip oscillation cycle at each step of the manipulation process and calculate the frequency shift by solving the equation of motion of the tip. The new model correctly reproduces previously unexplained key features of the experiment, and facilitates a better understanding of the mechanics of single-molecular junctions. Our simulations reveal that the surface corrugation adds a positive frequency shift to the measurement that generates an apparent repulsive force. Furthermore, we demonstrate that the scatter observed in the experimental data points is related to the sliding of the molecule across the surface.

  16. Diagnosis of cervical cancer cell taken from scanning electron and atomic force microscope images of the same patients using discrete wavelet entropy energy and Jensen Shannon, Hellinger, Triangle Measure classifier

    Science.gov (United States)

    Aytac Korkmaz, Sevcan

    2016-05-01

    The aim of this article is to provide early detection of cervical cancer by using both Atomic Force Microscope (AFM) and Scanning Electron Microscope (SEM) images of same patient. When the studies in the literature are examined, it is seen that the AFM and SEM images of the same patient are not used together for early diagnosis of cervical cancer. AFM and SEM images can be limited when using only one of them for the early detection of cervical cancer. Therefore, multi-modality solutions which give more accuracy results than single solutions have been realized in this paper. Optimum feature space has been obtained by Discrete Wavelet Entropy Energy (DWEE) applying to the 3 × 180 AFM and SEM images. Then, optimum features of these images are classified with Jensen Shannon, Hellinger, and Triangle Measure (JHT) Classifier for early diagnosis of cervical cancer. However, between classifiers which are Jensen Shannon, Hellinger, and triangle distance have been validated the measures via relationships. Afterwards, accuracy diagnosis of normal, benign, and malign cervical cancer cell was found by combining mean success rates of Jensen Shannon, Hellinger, and Triangle Measure which are connected with each other. Averages of accuracy diagnosis for AFM and SEM images by averaging the results obtained from these 3 classifiers are found as 98.29% and 97.10%, respectively. It has been observed that AFM images for early diagnosis of cervical cancer have higher performance than SEM images. Also in this article, surface roughness of malign AFM images in the result of the analysis made for the AFM images, according to the normal and benign AFM images is observed as larger, If the volume of particles has found as smaller. She has been a Faculty Member at Fırat University in the Electrical- Electronic Engineering Department since 2007. Her research interests include image processing, computer vision systems, pattern recognition, data fusion, wavelet theory, artificial neural

  17. Diagnosis of cervical cancer cell taken from scanning electron and atomic force microscope images of the same patients using discrete wavelet entropy energy and Jensen Shannon, Hellinger, Triangle Measure classifier.

    Science.gov (United States)

    Aytac Korkmaz, Sevcan

    2016-05-05

    The aim of this article is to provide early detection of cervical cancer by using both Atomic Force Microscope (AFM) and Scanning Electron Microscope (SEM) images of same patient. When the studies in the literature are examined, it is seen that the AFM and SEM images of the same patient are not used together for early diagnosis of cervical cancer. AFM and SEM images can be limited when using only one of them for the early detection of cervical cancer. Therefore, multi-modality solutions which give more accuracy results than single solutions have been realized in this paper. Optimum feature space has been obtained by Discrete Wavelet Entropy Energy (DWEE) applying to the 3×180 AFM and SEM images. Then, optimum features of these images are classified with Jensen Shannon, Hellinger, and Triangle Measure (JHT) Classifier for early diagnosis of cervical cancer. However, between classifiers which are Jensen Shannon, Hellinger, and triangle distance have been validated the measures via relationships. Afterwards, accuracy diagnosis of normal, benign, and malign cervical cancer cell was found by combining mean success rates of Jensen Shannon, Hellinger, and Triangle Measure which are connected with each other. Averages of accuracy diagnosis for AFM and SEM images by averaging the results obtained from these 3 classifiers are found as 98.29% and 97.10%, respectively. It has been observed that AFM images for early diagnosis of cervical cancer have higher performance than SEM images. Also in this article, surface roughness of malign AFM images in the result of the analysis made for the AFM images, according to the normal and benign AFM images is observed as larger, If the volume of particles has found as smaller.

  18. Variable - temperature scanning optical and force microscope

    OpenAIRE

    2004-01-01

    The implementation of a scanning microscope capable of working in confocal, atomic force and apertureless near field configurations is presented. The microscope is designed to operate in the temperature range 4 - 300 K, using conventional helium flow cryostats. In AFM mode, the distance between the sample and an etched tungsten tip is controlled by a self - sensing piezoelectric tuning fork. The vertical position of both the AFM head and microscope objective can be accurately controlled using...

  19. Collection of trace evidence of explosive residues from the skin in a death due to a disguised letter bomb. The synergy between confocal laser scanning microscope and inductively coupled plasma atomic emission spectrometer analyses.

    Science.gov (United States)

    Turillazzi, Emanuela; Monaci, Fabrizio; Neri, Margherita; Pomara, Cristoforo; Riezzo, Irene; Baroni, Davide; Fineschi, Vittorio

    2010-04-15

    In most deaths caused by explosive, the victim's body becomes a depot for fragments of explosive materials, so contributing to the collection of trace evidence which may provide clues about the specific type of device used with explosion. Improvised explosive devices are used which contain "homemade" explosives rather than high explosives because of the relative ease with which such components can be procured. Many methods such as chromatography-mass spectrometry, scanning electron microscopy, stereomicroscopy, capillary electrophoresis are available for use in the identification of explosive residues on objects and bomb fragments. Identification and reconstruction of the distribution of explosive residues on the decedent's body may give additional hints in assessing the position of the victim in relation to the device. Traditionally these residues are retrieved by swabbing the body and clothing during the early phase, at autopsy. Gas chromatography-mass spectrometry and other analytical methods may be used to analyze the material swabbed from the victim body. The histological examination of explosive residues on skin samples collected during the autopsy may reveal significant details. The information about type, quantity and particularly about anatomical distribution of explosive residues obtained utilizing confocal laser scanning microscope (CLSM) together with inductively coupled plasma atomic emission spectrometer (ICP-AES), may provide very significant evidence in the clarification and reconstruction of the explosive-related events.

  20. Spin microscope based on optically detected magnetic resonance

    Science.gov (United States)

    Berman, Gennady P.; Chernobrod, Boris M.

    2007-12-11

    The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

  1. 原子力显微镜对常用7种单克隆抗体形态的观察%Morphologies of seven commonly used monoclonal antibodies under atomic force microscope

    Institute of Scientific and Technical Information of China (English)

    侯永微; 纪小龙; 王美娥

    2013-01-01

    Objective To lay the foundation for establishing a morphological structure database of commonly used antibodies by studying the morphology of antigen-antibody reaction under atomic forced microscope. Methods Seven antibodies were added onto slides and placed into a wet kit containing 10%neutral buffer formalin. One hour after the antibodies were kept in an incubator at 37℃, they were washed with distilled water and dried. Their morphologies were observed under atomic force microscope. The width, maximum height and mean roughness of particles were measured. Results The long rod cytokeratin and S100 protein muse anti-human monoclonal antibodies, the oblate round common antigens of vimentin and leukocyte as well as cytokeratin 7 and Dog-1 mouse antihuman monoclonal antibodies, and the triangle thyroglobulin monoclonal antibodies were observed in 2D figures. The width and maximum height of monoclonal antibodies were significantly different (P0.05). Conclusion The morphologies of 7 monoclonal antibodies can be divided into long rod, oblate round and triangle types, which directly prove the relative specificity of antibodies and can thus provide the morphological foundation for further studying the co-expression and exceptional expression of antigens.%  目的为抗原抗体反应提供原子力显微镜下的形态学基础,为建立常用抗体形态结构的形态库打下基础。方法将7种常用单克隆抗体分别滴加于载玻片上,放入加有10%中性缓冲甲醛的湿盒内,置于37℃温箱中1 h,用蒸馏水轻轻涮洗,晾干,用原子力显微镜(atomic force microscope,AFM)进行扫描,观察形态,测量扫描颗粒的宽度、最大峰高度和平均粗糙度。结果在2D图中,细胞角蛋白(广谱)、S100蛋白鼠抗人单克隆抗体为长杆状,波形蛋白、白细胞共同抗原、细胞角蛋白7、Dog-1鼠抗人单克隆抗体为类圆形,甲状腺球蛋白鼠抗人单克隆抗体为三角形;不同组间

  2. Food toxin detection with atomic force microscope

    Science.gov (United States)

    Externally introduced toxins or internal spoilage correlated pathogens and their metabolites are all potential sources of food toxins. To prevent and protect unsafe food, many food toxin detection techniques have been developed to detect various toxins for quality control. Although several routine m...

  3. Atomic Force Microscope 1: Veeco Dimension 3100

    Data.gov (United States)

    Federal Laboratory Consortium — Description: CORAL Name: AFM 1 A tool used to characterize the material surface, nanostructures generated by nanofabrication, nanomanipulation, and nanolithography....

  4. Microscopic origin of magnetoresistance

    Directory of Open Access Journals (Sweden)

    Christian Heiliger

    2006-11-01

    Full Text Available Tunneling magnetoresistance is one of the basic effects of spintronics with the potential for applications in sensors and IT, where the spin degree of freedom of electrons is exploited. Successful application requires control of the materials and processes involved on the atomic scale. To support experimental developments, predict new materials, and optimize the effect, first-principle electronic structure calculations based on density functional theory are the most powerful tool. The method gives an insight into the microscopic origin of spin-dependent tunneling. The main components of a planar tunnel junction – barrier, leads, and their interface – and their specific role for tunneling magnetoresistance are discussed for one of the standard systems, Fe/MgO/Fe.

  5. A comparative evaluation of the effect of 5.25% sodium hypochlorite and 2% chlorhexidine on the surface texture of Gutta-percha and resilon cones using atomic force microscope

    Directory of Open Access Journals (Sweden)

    Mahima Tilakchand

    2014-01-01

    Full Text Available Aims & Objectives: The purpose of this study was to investigate the effects of 5.25% sodium hypochlorite (NaOCl and 2% chlorhexidine (CHX on Gutta-percha and Resilon cones using an atomic force microscope (AFM. Materials and Methods: Gutta-percha cones (n = 15 and Resilon cones (n = 15 were cut 3 mm from their tip, attached to a glass slide with cyanoacrylate glue and immersed in 5.25% NaOCl and CHX for 1, 5, 10, 20 and 30 min. Five each of Gutta-percha and Resilon cones not treated with any disinfectant were used as control. The analysis of the surface topography was performed on the region between 1 and 2 mm from the tip using the AFM. The root mean square (RMS parameters for contact mode imaging were measured. The differences between RMS values were tested by SPSS-16.0 version statistical software [IBM SPSS (Statistical Product and Service Solutions Data Software, Chicago, US] using Kruskal-Wallis ANOVA, Mann-Whitney U-test and Wilcoxon matched pairs test. Results: There was no deterioration in the surfac e topography of Gutta-percha and Resilon when treated with 2% CHX in comparison to baseline (P < 0.05. Resilon exhibited no deterioration in topography when immersed in 5.25% NaOCl. There was a significant decrease in the mean RMS values of Gutta-percha treated with NaOCl from the control at time intervals of 1, 5, 10, 20 and 30 min.

  6. The Contact Measuring Head of in Dual-probe Atomic Force Microscope%原子力显微镜的双探针接触测量研究

    Institute of Scientific and Technical Information of China (English)

    张华坤; 高思田; 李伟

    2016-01-01

    In order to align two probes of dual-probe atomic force microscope( AFM ),it is necessary to establish a measuring head to do in-depth research on the probe A scanning the probe B. Firstly,the mechanical characteristics of the probe are obtained by finite element( FE)simulations. Secondly,using the locked-in amplifier to attain the amplitude and frequency signals to analyze the system resolution( better than 1 nm),the probe is rotated 90 degrees compared traditional AFM. Lastly,probe B is scanned by probe A in YOZ plane,reducing the scanning range and scanning step gradually. The alignment accuracy is of 5 nm.%为实现双探针原子力显微镜的探针对准,用探针A对探针B的成像进行了深入的研究。首先对音叉探针进行有限元仿真,分析探针的机械特性。其次用锁相放大器获取探针的幅度和频率信号,让探针接近样品(硅片)以获得系统的分辨率。最后在YOZ平面用探针A对探针B扫描成像,逐步缩小扫描范围并同时减小扫描步进。实验表明,探针的分辨率优于1 nm,双探针对准精度可达5 nm。

  7. Nanoscale study of the ferroelectric properties of SrBi{sub 2}Nb{sub 2}O{sub 9} thin films grown by pulsed laser deposition on epitaxial Pt electrodes using atomic force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Gautier, Brice; Duclere, Jean-Rene; Guilloux-Viry, Maryline

    2003-07-15

    SrBi{sub 2}Nb{sub 2}O{sub 9} (SBN) thin films deposited by laser ablation on epitaxial (1 0 0)Pt and (1 1 0)Pt have been studied using an atomic force microscope (AFM) in the so-called 'piezoresponse' mode. Previous X-ray studies have shown that in the first case two different orientations coexist in the film: a predominant (0 0 1) orientation with a (1 1 5) orientation. AFM topographical images reveal the presence of two different kinds of grains of different shape corresponding to each orientation and AFM piezoresponse images are in agreement with the crystallographic orientation of the grains: only the expected (1 1 5) oriented grains show a piezoelectric contrast. Moreover, hysteresis loops are obtained over (1 1 5) grains and not over (0 0 1) regions. Although (1 1 5) grains can be in a monodomain state, they also show intragranular ferroelectric domains with nanometric sizes, which orientation can be reversed by applying a dc field between the AFM tip and the grounded conductive bottom electrode of the sample. In the second case, the use of a (1 1 0)Pt electrode instead of a (1 0 0)Pt electrode leads to preferentially (1 1 6) SBN oriented films, inducing far better ferroelectrics properties. In spite of a weak remnant polarization, the surface shows an homogeneous polarization when a 1 {mu}mx1 {mu}m area is probed after the reversal of the polarization by the AFM tip.

  8. Microstructural Observation of Leucaena glaucal Seed Polysaccharides under Atomic Force Microscope%银合欢种子多糖微结构的原子力显微镜观察

    Institute of Scientific and Technical Information of China (English)

    杨永利; 郭守军; 叶文斌; 潘显辉; 林月娟; 林海雄

    2012-01-01

    Objective: The microstructure of Leucaena glaucal seed polysaccharides was studied based on morphological observation under atomic force microscope(AFM).Methods: Polysaccharides from were extracted by hot water extraction.The structure and morphology of aggregates and non-aggregates from Leucaena glaucal seed polysaccharides formed through varying polysaccharide concentration or chemically modifying the surface of mica substrates were visualized under AFM.Results: Membranous,granular aggregates structure and non-aggregate structure of a single polysaccharide molecule could be observed in the samples prepared at various conditions.Conclusion: A single Leucaena glaucal seeds polysaccharide molecule was linear spiral,and had short branch structure and entangled molecular chains to form a reticulation structure.%目的:通过对银合欢种子多糖的形貌观察,研究其微结构。方法:采用热水浸提法提取银合欢种子多糖,通过改变溶液的质量浓度、云母基底表面的化学修饰等不同制样方式,用原子力显微镜(AFM)可视化不同样品制备条件形成的聚集体和非聚集体银合欢半乳甘露聚糖结构形貌。结果:样品在不同制备条件下得到膜状、颗粒状的聚集体结构和非聚集体单糖分子结构。结论:银合欢种子多糖的单个糖分子呈线形螺旋状,并具有短的分枝结构,分子链间互相缠绕,而形成网格状。

  9. Atomic and molecular manipulation

    CERN Document Server

    Mayne, Andrew J

    2011-01-01

    Work with individual atoms and molecules aims to demonstrate that miniaturized electronic, optical, magnetic, and mechanical devices can operate ultimately even at the level of a single atom or molecule. As such, atomic and molecular manipulation has played an emblematic role in the development of the field of nanoscience. New methods based on the use of the scanning tunnelling microscope (STM) have been developed to characterize and manipulate all the degrees of freedom of individual atoms and molecules with an unprecedented precision. In the meantime, new concepts have emerged to design molecules and substrates having specific optical, mechanical and electronic functions, thus opening the way to the fabrication of real nano-machines. Manipulation of individual atoms and molecules has also opened up completely new areas of research and knowledge, raising fundamental questions of "Optics at the atomic scale", "Mechanics at the atomic scale", Electronics at the atomic scale", "Quantum physics at the atomic sca...

  10. Isotope analysis in the transmission electron microscope

    CERN Document Server

    Susi, Toma; Argentero, Giacomo; Leuthner, Gregor T; Pennycook, Timothy J; Mangler, Clemens; Meyer, Jannik C; Kotakoski, Jani

    2016-01-01

    The {\\AA}ngstr\\"om-sized probe of the scanning transmission electron microscope can visualize and collect spectra from single atoms. This can unambiguously resolve the chemical structure of materials, but not their isotopic composition. Here we differentiate between two isotopes of the same element by quantifying how likely the energetic imaging electrons are to eject atoms. First, we measure the displacement probability in graphene grown from either $^{12}$C or $^{13}$C and describe the process using a quantum mechanical model of lattice vibrations coupled with density functional theory simulations. We then test our spatial resolution in a mixed sample by ejecting individual atoms from nanoscale areas spanning an interface region that is far from atomically sharp, mapping the isotope concentration with a precision better than 20%. Although we use a scanning instrument, our method should be applicable to any atomic resolution transmission electron microscope and to other low-dimensional materials.

  11. Characteristics of a high brightness gaseous field ion source employing tungsten-carbon doped NiAl needles

    Energy Technology Data Exchange (ETDEWEB)

    Mousa, Marwan S., E-mail: mmousa@mutah.edu.jo [Department of Physics, Mu' tah University, P.O. Box 7, Al-Karak (Jordan)

    2011-05-15

    We report on the characterization of a high brightness gaseous field ion source using an emitter made of a NiAl needle containing tiny spherical tungsten-carbon precipitates. By field evaporation of such a multiphase alloy, a surface protrusion is formed out of a precipitate, which can act as a small source size field ion emitter. The emission current-voltage characteristics of this emitter were recorded for a variety of parameters. The results obtained suggest that its application as a stable ion source is possible even on long term operation. -- Research highlights: {yields} High brightness gaseous field ion source of precipitation hardened NiAl+W+C emitter. {yields} Emission current-voltage characteristics are recorded for a variety of parameters. {yields} Very small virtual source sizes and energy spreads can be attained. {yields} Results suggest that application as long term stable ion source is possible.

  12. Envejecimiento de Almidones Termoplásticos Agrios de Yuca y Nativos de Papa por Microscopía de Fuerza Atómica Ageing of Sour Cassava and Native Potato Thermoplastic Starches by Atomic Force Microscopy

    Directory of Open Access Journals (Sweden)

    Harold A Acosta

    2006-01-01

    Full Text Available En este trabajo, se determinó la topografía de almidones termoplásticos (TPS agrio de yuca y nativo de papa, mediante microscopía de fuerza atómica (AFM, durante un periodo de 120 días de almacenamiento. Mezclas de almidones agrios (fermentados de yuca y nativo de papa, y glicerina, se procesaron en un extrusor de husillo sencillo. Láminas de TPS agrio de yuca (SCTPS y nativo de papa (NPTPS, se observaron y midieron por AFM (en modo contacto. Sus superficies mostraron incremento en rugosidad y partes lisas solo a altos contenidos de plastificante, pero SCTPS siempre tuvo menor rugosidad que NPTPS, debido a la fermentación natural del almidón agrio. Estos cambios se relacionaron con el tamaño, la forma del gránulo y particularmente con el contenido de plastificante. Los NPTPS de mayor rugosidad presentaron separación de fases a los 120 días, dada la retrogradación de las moléculas del almidón, que tienden a formar cristalitos. Estos resultados indican que el almidón agrio de yuca puede retardar la retrogradación de almidones termoplásticos, lo cual es importante durante el desarrollo de nuevos empaques biodegradables.This study reports on the topography of thermoplastic starches (TPS from sour cassava and native potato using atomic force microscopy (AFM, over a 120 day-storage period. Mixtures of sour cassava (fermented and native potato starches plus glycerine, were processed using a single-screw extruder. Sour cassava thermoplastic starch (SCTPS and native potato thermoplastic starch (NPTPS films were observed and measured by AFM (in contact mode. Their surfaces showed increased rugosity, and smooth parts only at high plasticizer content. However, SCTPS always had lower rugosity than NPTPS, due to the natural fermentation of sour cassava starch. These changes were related to starch granule size and shape, and particularly to plasticizer content. NPTPS with higher rugosity presented phase separation at 120 days, due to

  13. 白术多糖WAM-1结构的色谱分析和原子力显微镜观察%Chromatographic Analysis and Atomic Force Microscope Observation of Polysaccharide Extracted from Atractylodes macrocephala Koidz.

    Institute of Scientific and Technical Information of China (English)

    伍乐芹; 姜绍芬; 张静

    2012-01-01

    Polysaccharides extracted from the stem of Atractylodes macrocephala Koidz by hot water,were fractionated by DEAE-52 cellulose chromatography,and purified by Sephadex G-200 gel filtration chromatography to obtain a fraction, named WAM-1. HPLC and GC analysis showed that WAM-1 was a homogeneous and consisted of glucose and galactose in the molar ratio of 3. 01: 1. The molecular morphology of WAM-1 was observed under an atomic force microscope (AFM).The results showed that WAM-1 existed in different forms with different concentrations. The concentration of polysaccharide had effects on the conformation and form of chain interactions, which might be related to the interaction of intramolecular and intermolecular hydrogen bonds. At 10 μg/mL,the morphology of WAM-1 was observed clearly in rigid chains with many branches.%通过热水浸提法从草本植物白术根茎提取的水溶性粗多糖,经DEAE-52纤维素柱层析分离和Sephadex G-200凝胶过滤柱层析纯化,得到组分WAM-1.采用高效液相色谱(HPLC)检测WAM-1的纯度,气相色谱(GC)对其单糖组分进行分析,原子力显微镜(AFM)对其分子外貌进行观测.结果显示:WAM-1为均一多糖,由葡萄糖和半乳糖以3.01:1摩尔比构成;在不同浓度溶液条件下,WAM-1分子以不同形态存在,多糖溶液的浓度对WAM-1的分子链构象及链间相互作用形式产生影响,推测可能与WAM-1分子内、分子间的氢键缔合作用有关.多糖浓度为10μg/mL时,可清晰的观察到WAM-1是以刚性链状形态存在,且具有多分支结构.

  14. Cold atoms close to surfaces

    DEFF Research Database (Denmark)

    Krüger, Peter; Wildermuth, Stephan; Hofferberth, Sebastian

    2005-01-01

    Microscopic atom optical devices integrated on atom chips allow to precisely control and manipulate ultra-cold (T atoms and Bose-Einstein condensates (BECs) close to surfaces. The relevant energy scale of a BEC is extremely small (down to ... be utilized as a sensor for variations of the potential energy of the atoms close to the surface. Here we describe how to use trapped atoms as a measurement device and analyze the performance and flexibility of the field sensor. We demonstrate microscopic magnetic imaging with simultaneous high spatial...

  15. Visions of Atomic Scale Tomography

    Energy Technology Data Exchange (ETDEWEB)

    Kelly, T. F. [Cameca Instruments; Miller, Michael K [ORNL; Rajan, Krishna [Iowa State University; Ringer, S. P. [University of Sydney, Australia

    2012-01-01

    A microscope, by definition, provides structural and analytical information about objects that are too small to see with the unaided eye. From the very first microscope, efforts to improve its capabilities and push them to ever-finer length scales have been pursued. In this context, it would seem that the concept of an ultimate microscope would have received much attention by now; but has it really ever been defined? Human knowledge extends to structures on a scale much finer than atoms, so it might seem that a proton-scale microscope or a quark-scale microscope would be the ultimate. However, we argue that an atomic-scale microscope is the ultimate for the following reason: the smallest building block for either synthetic structures or natural structures is the atom. Indeed, humans and nature both engineer structures with atoms, not quarks. So far as we know, all building blocks (atoms) of a given type are identical; it is the assembly of the building blocks that makes a useful structure. Thus, would a microscope that determines the position and identity of every atom in a structure with high precision and for large volumes be the ultimate microscope? We argue, yes. In this article, we consider how it could be built, and we ponder the answer to the equally important follow-on questions: who would care if it is built, and what could be achieved with it?

  16. Designs for a Quantum Electron Microscope

    CERN Document Server

    Kruit, Pieter; Kim, Chung-Soo; Yang, Yujia; Manfrinato, Vitor R; Hammer, Jacob; Thomas, Sebastian; Weber, Philipp; Klopfer, Brannon; Kohstall, Christoph; Juffmann, Thomas; Kasevich, Mark A; Hommelhoff, Peter; Berggren, Karl K

    2015-01-01

    One of the astounding consequences of quantum mechanics is that it allows the detection of a target using an incident probe, with only a low probability of interaction of the probe and the target. This 'quantum weirdness' could be applied in the field of electron microscopy to generate images of beam-sensitive specimens with substantially reduced damage to the specimen. A reduction of beam-induced damage to specimens is especially of great importance if it can enable imaging of biological specimens with atomic resolution. Following a recent suggestion that interaction-free measurements are possible with electrons, we now analyze the difficulties of actually building an atomic resolution interaction-free electron microscope, or "quantum electron microscope". A quantum electron microscope would require a number of unique components not found in conventional transmission electron microscopes. These components include a coherent electron-beam splitter or two-state-coupler, and a resonator structure to allow each ...

  17. Transmission positron microscopes

    Energy Technology Data Exchange (ETDEWEB)

    Doyama, Masao [Teikyo University of Science and Technology, Uenohara, Yamanashi 409-0193 (Japan)]. E-mail: doyama@ntu.ac.jp; Kogure, Yoshiaki [Teikyo University of Science and Technology, Uenohara, Yamanashi 409-0193 (Japan); Inoue, Miyoshi [Teikyo University of Science and Technology, Uenohara, Yamanashi 409-0193 (Japan); Kurihara, Toshikazu [Institute of Materials Structure Science (IMSS), High Energy Accelerator, Research Organization (KEK), Ohno 1-1, Tsukuba, Ibaraki 305-0801 (Japan); Yoshiie, Toshimasa [Reactor Research Institute, Kyoto University, Noda, Kumatori, Osaka 590-0451 (Japan); Oshima, Ryuichiro [Research Institute for Advanced Science and Technology, Osaka Prefecture University (Japan); Matsuya, Miyuki [Electron Optics Laboratory (JEOL) Ltd., Musashino 3-1-2, Akishima 196-0021 (Japan)

    2006-02-28

    Immediate and near-future plans for transmission positron microscopes being built at KEK, Tsukuba, Japan, are described. The characteristic feature of this project is remolding a commercial electron microscope to a positron microscope. A point source of electrons kept at a negative high voltage is changed to a point source of positrons kept at a high positive voltage. Positional resolution of transmission microscopes should be theoretically the same as electron microscopes. Positron microscopes utilizing trapping of positrons have always positional ambiguity due to the diffusion of positrons.

  18. 蛋白质对 PVDF 超滤膜污染行为的界面微观作用力解析%Adhesion Force Analysis of Protein Fouling of PVDF Ultrafiltration Membrane Using Atomic Force Microscope

    Institute of Scientific and Technical Information of China (English)

    王旭东; 周淼; 孟晓荣; 王磊; 黄丹曦; 夏四清

    2015-01-01

    To determine the fouling behavior of bovine serum albumin (BSA) on different hydrophilic PVDF ultrafiltration membrane over a range of pH, atomic force microscopy (AFM) and self-made colloidal probes were used to detect the microscopic adhesion forces of membrane-BSA and BSA-BSA, respectively. The results showed a positive correlation between the flux decline extent and the membrane-foulant adhesion force in the initial filtration stage, whereas the foulant-foulant interaction force was closely related to the membrane fouling in the later filtration stage. Moreover, the membrane-BSA adhesion interaction was stronger than the BSA-BSA adhesion interaction, which indicated that the fouling was mainly caused by the adhesion interaction between membrane and foulant. At the same pH, the adhesion force between PA membrane-BSA was smaller than that of PP membrane-BSA, illustrating the more hydrophilic the membrane was, the better the antifouling ability it had. The adhesion force between BSA-BSA fouled PA membrane was similar to that between BSA-BSA fouled PP membrane. These results confirmed that elimination of the membrane-BSA adhesion force is important to control the protein fouling of membranes.%采用原子力显微镜,结合自制微颗粒探针,对膜-污染物及污染物-污染物间微观作用力进行了检测分析,考察了不同 pH条件下牛血清蛋白(BSA)在不同界面特性 PVDF 超滤膜上的膜污染行为。结果表明,在膜过滤初期,通量剧烈衰减主要由 BSA和膜之间黏附力作用导致,在膜过滤后期,BSA 与 BSA 之间的黏聚作用则是影响后期膜污染行为的主要因素; PA 膜-BSA 和PP 膜-BSA 之间的黏附作用力均大于 BSA-BSA 之间的黏聚作用力,说明在整个膜过滤过程中,BSA 与 PVDF 超滤膜之间的黏附作用对膜污染起主导作用;相同 pH 条件下,PA 膜-BSA 之间的微观作用小于 PP 膜-BSA 之间的相互作用力,说明亲水性较强的 PA 膜具

  19. Reviews Book: Sustainable Energy—Without the Hot Air Equipment: Doppler Effect Unit Book: The Physics of Rugby Book: Plastic Fantastic: How the Biggest Fraud in Physics Shook the Scientific World Equipment: Brunel Eyecam Equipment: 200x Digital Microscope Book: The Atom and the Apple: Twelve Tales from Contemporary Physics Book: Physics 2 for OCR Web Watch

    Science.gov (United States)

    2009-09-01

    WE RECOMMEND Sustainable Energy—Without the Hot Air This excellent book makes sense of energy facts and figures Doppler Effect Unit Another simple, effective piece of kit from SEP Plastic Fantastic: How the Biggest Fraud in Physics Shook the Scientific World Intriguing and unique write-up of an intellectual fraud case Brunel Eyecam An affordable digital eyepiece for your microscope 200x Digital Microscope An adjustable digital flexcam for classroom use The Atom and the Apple: Twelve Tales from Contemporary Physics A fascinating round-up of the recent history of physics WORTH A LOOK The Physics of Rugby Book uses sport analogy and context to teach physics concepts Physics 2 for OCR Essential textbook for the course but otherwise pointless WEB WATCH Some free teaching materials are better than those you'd pay for

  20. Reflections on the projection of ions in atom probe tomography

    OpenAIRE

    De Geuser, Frédéric; Gault, Baptiste

    2016-01-01

    There are two main projections used to transform, and reconstruct, field ion micrographs or atom probe tomography data into atomic coordinates at the specimen surface and, subsequently, in three-dimensions. In this article, we present a perspective on the strength of the azimuthal equidistant projection in comparison to the more widely used and well-established point-projection(or pseudo-stereographic projection), which underpins data reconstruction in most software packages currently in use ...

  1. Designs for a quantum electron microscope.

    Science.gov (United States)

    Kruit, P; Hobbs, R G; Kim, C-S; Yang, Y; Manfrinato, V R; Hammer, J; Thomas, S; Weber, P; Klopfer, B; Kohstall, C; Juffmann, T; Kasevich, M A; Hommelhoff, P; Berggren, K K

    2016-05-01

    One of the astounding consequences of quantum mechanics is that it allows the detection of a target using an incident probe, with only a low probability of interaction of the probe and the target. This 'quantum weirdness' could be applied in the field of electron microscopy to generate images of beam-sensitive specimens with substantially reduced damage to the specimen. A reduction of beam-induced damage to specimens is especially of great importance if it can enable imaging of biological specimens with atomic resolution. Following a recent suggestion that interaction-free measurements are possible with electrons, we now analyze the difficulties of actually building an atomic resolution interaction-free electron microscope, or "quantum electron microscope". A quantum electron microscope would require a number of unique components not found in conventional transmission electron microscopes. These components include a coherent electron beam-splitter or two-state-coupler, and a resonator structure to allow each electron to interrogate the specimen multiple times, thus supporting high success probabilities for interaction-free detection of the specimen. Different system designs are presented here, which are based on four different choices of two-state-couplers: a thin crystal, a grating mirror, a standing light wave and an electro-dynamical pseudopotential. Challenges for the detailed electron optical design are identified as future directions for development. While it is concluded that it should be possible to build an atomic resolution quantum electron microscope, we have also identified a number of hurdles to the development of such a microscope and further theoretical investigations that will be required to enable a complete interpretation of the images produced by such a microscope. Copyright © 2016 The Authors. Published by Elsevier B.V. All rights reserved.

  2. Nanometer scale tomographic investigation of fine scale precipitates in a CuFeNi granular system by three-dimensional field ion microscopy.

    Science.gov (United States)

    Cazottes, Sophie; Vurpillot, François; Fnidiki, Abdeslem; Lemarchand, Dany; Baricco, Marcello; Danoix, Frederic

    2012-10-01

    The microstructure of Cu80Fe10Ni10 (at. %) granular ribbons was investigated by means of three-dimensional field ion microscopy (3D FIM). This ribbon is composed of magnetic precipitates embedded in a nonmagnetic matrix. The magnetic precipitates have a diameter smaller than 5 nm in the as-spun state and are coherent with the matrix. No accurate characterization of such a microstructure has been performed so far. A tomographic characterization of the microstructure of melt spun and annealed Cu80Fe10Ni10 ribbon was achieved with 3D FIM at the atomic scale. A precise determination of the size distribution, number density, and distance between the precipitates was carried out. The mean diameter for the precipitates is 4 nm in the as-spun state. After 2 h at 350°C, there is an increase of the size of the precipitates, while after 2 h at 400°C the mean diameter of the precipitates decreases. Those data were used as inputs in models that describe the magnetic and magnetoresistive properties of this alloy.

  3. Cryogenic immersion microscope

    Science.gov (United States)

    Le Gros, Mark; Larabell, Carolyn A.

    2010-12-14

    A cryogenic immersion microscope whose objective lens is at least partially in contact with a liquid reservoir of a cryogenic liquid, in which reservoir a sample of interest is immersed is disclosed. When the cryogenic liquid has an index of refraction that reduces refraction at interfaces between the lens and the sample, overall resolution and image quality are improved. A combination of an immersion microscope and x-ray microscope, suitable for imaging at cryogenic temperatures is also disclosed.

  4. Analytical Electron Microscope

    Data.gov (United States)

    Federal Laboratory Consortium — The Titan 80-300 is a transmission electron microscope (TEM) equipped with spectroscopic detectors to allow chemical, elemental, and other analytical measurements to...

  5. FY 1999 achievement report on the project on the R and D of industrial science technology. R and D of the atom/molecule limit operation technology (Development of high-functional material formation technology for electric power generation environment); 1999 nendo genshi bunshi kyokugen sosa gijutsu no kenkyu kaihatsu seika hokokusho. Hatsuden kankyoyo kokino sozai keisei gijutsu kaihatsu

    Energy Technology Data Exchange (ETDEWEB)

    NONE

    2000-03-01

    The paper described the FY 1999 results of the study of atomic technology. Using a combined system of the scanning tunnel microscope (STM) with the field ion microscope and the atom probe (AP), a few Ag atoms were identified. Si windows were formed by electron beam irradiated from a STM tip, and Ge nanocrystal array was formed at the windows by supplying GeH4 gas. Iron clusters were deposited on Si substrates. With those as nuclei and in self-formation for etching masks, Si pillar distribution nano-crystals were etching-processed. The oxidation process of clean Si surface using ultra-high vacuum electron spin resonance was observed, and the incomplete state of the Si oxidation process was observed. Perovskite oxide superlattices composed of the two kinds were fabricated using the laser ablation method. The layer type antiferromagnetic spin arrangement is artificially modulated in the superlattices along the stacking direction. To observe the magnetic nano-structure, the development was commenced of a spin-polarized STM. The paper theoretically analyzed the dynamic process of atoms and molecules. (NEDO)

  6. Mailing microscope slides

    Science.gov (United States)

    Many insects feed agriculturally important crops, trees, and ornamental plants and cause millions of dollars of damage annually. Identification for some of these require the preparation of a microscope slide for examination. There are times when a microscope slide may need to be sent away to a speci...

  7. Project in fiscal 2000 of research and development of industrial and scientific technologies. Achievement report on 'research and development of ultimate atom and molecule operation technology' (development of technology to form high-function materials for electric power generating environment); 2000 nendo genshi bunshi kyokugen sosa gijutsu no kenkyu kaihatsu seika hokokusho. Hatsuden kankyoyo kokino sozai keisei gijutsu kaihatsu

    Energy Technology Data Exchange (ETDEWEB)

    NONE

    2001-03-01

    Research and development has been performed with an intention of establishing an observation technology and an operation technology of atoms and molecules, as a common infrastructural technology in different industrial fields. This paper reports the achievements in fiscal 2000. In the research of an inorganic atom and molecule identification and operation technology, a composite device constructed of an STM and an electric field ion microscope/atom probe was used to draw out and identify two or three Ag atoms from Si:Ag surface and show clearly the correspondence with the original atomic positions. In the research of a technology to form and control nano-structures on surface and interface, Ge/Si hetero nano crystals with a size of 20 nm were formed on Si nano crystals formed on an opening in the atom layer oxide film on an Si substrate. Furthermore, hetero nano crystals of Si/Ge/Si, in which Ge nano crystals are embedded in Si nano crystals, were formed successfully. In the research of a spin electronics technology, research was performed, with regard to perovskite vanadium oxides, on decay of the orbital order due to changing the band filling, and insulating metal transition. (NEDO)

  8. Microfabrication of gold wires for atom guides

    OpenAIRE

    Kukharenka, Elena; Moktadir, Zak; Kraft, Michael; Abdelsalam, M.E.; Bagnall, Darren; Vale, C.; Jones, M. P. A.; Hinds, E.A.

    2004-01-01

    Miniaturised atom optics is a new field allowing the control of cold atoms in microscopic magnetic traps and waveguides. Using microstructures (hereafter referred to as atom chips), the control of cold atoms on the micrometer scale becomes possible. Applications range from integrated atom interferometers to the realisation of quantum gates. The implementation of such structures requires high magnetic field gradients.\\ud The motivation of this work was to develop a suitable fabrication process...

  9. [Microscopic colitis: update 2014].

    Science.gov (United States)

    Burgmann, Konstantin; Fraga, Montserrat; Schoepfer, Alain M; Yun, Pu

    2014-09-03

    Microscopic colitis, which includes lymphocytic colitis and collagenous colitis, represents a frequent cause of chronic watery diarrhea especially in the elderly population. Several medications, such as nonsteroidal antiinflammatory drugs, proton pump inhibitors or antidepressants, as well as cigarette smoking have been recognized as risk factors for microscopic colitis. The diagnosis of microscopic colitis is based on a macroscopically normal ileo-colonoscopy and several biopsies from the entire colon, which demonstrate the pathognomonic histopathologic findings. Therapy is mainly based on the use of budesonide. Other medications, such as mesalazine, cholestyramine and bismuth, have been evaluated as well but the evidence is less solid.

  10. Hyperspectral confocal microscope.

    Science.gov (United States)

    Sinclair, Michael B; Haaland, David M; Timlin, Jerilyn A; Jones, Howland D T

    2006-08-20

    We have developed a new, high performance, hyperspectral microscope for biological and other applications. For each voxel within a three-dimensional specimen, the microscope simultaneously records the emission spectrum from 500 nm to 800 nm, with better than 3 nm spectral resolution. The microscope features a fully confocal design to ensure high spatial resolution and high quality optical sectioning. Optical throughput and detection efficiency are maximized through the use of a custom prism spectrometer and a backside thinned electron multiplying charge coupled device (EMCCD) array. A custom readout mode and synchronization scheme enable 512-point spectra to be recorded at a rate of 8300 spectra per second. In addition, the EMCCD readout mode eliminates curvature and keystone artifacts that often plague spectral imaging systems. The architecture of the new microscope is described in detail, and hyperspectral images from several specimens are presented.

  11. Microscopic approach to polaritons

    DEFF Research Database (Denmark)

    Skettrup, Torben

    1981-01-01

    contrary to experimental experience. In order to remove this absurdity the semiclassical approach must be abandoned and the electromagnetic field quantized. A simple microscopic polariton model is then derived. From this the wave function for the interacting exciton-photon complex is obtained...... of light of the crystal. The introduction of damping smears out the excitonic spectra. The wave function of the polariton, however, turns out to be very independent of damping up to large damping values. Finally, this simplified microscopic polariton model is compared with the exact solutions obtained...... for the macroscopic polariton model by Hopfield. It is seen that standing photon and exciton waves must be included in an exact microscopic polariton model. However, it is concluded that for practical purposes, only the propagating waves are of importance and the simple microscopic polariton wave function derived...

  12. Scanning Auger Electron Microscope

    Data.gov (United States)

    Federal Laboratory Consortium — A JEOL model 7830F field emission source, scanning Auger microscope. Specifications / Capabilities: Ultra-high vacuum (UHV), electron gun range from 0.1 kV to 25 kV,...

  13. The Correlation Confocal Microscope

    CERN Document Server

    Simon, D S

    2010-01-01

    A new type of confocal microscope is described which makes use of intensity correlations between spatially correlated beams of light. It is shown that this apparatus leads to significantly improved transverse resolution.

  14. Scanning Auger Electron Microscope

    Data.gov (United States)

    Federal Laboratory Consortium — A JEOL model 7830F field emission source, scanning Auger microscope.Specifications / Capabilities:Ultra-high vacuum (UHV), electron gun range from 0.1 kV to 25 kV,...

  15. Coherent matter wave optics on an atom chip

    DEFF Research Database (Denmark)

    Krüger, Peter; Hofferberth, S.; Schumm, Thorsten

    2006-01-01

    Coherent manipulation of matter waves in microscopic trapping potentials facilitates both fundamental and technological applications. Here we focus on experiments with a microscopic integrated interferometer that demonstrate coherent operation on an atom chip.......Coherent manipulation of matter waves in microscopic trapping potentials facilitates both fundamental and technological applications. Here we focus on experiments with a microscopic integrated interferometer that demonstrate coherent operation on an atom chip....

  16. Microscopic colitis: a review.

    Science.gov (United States)

    Farrukh, A; Mayberry, J F

    2014-12-01

    In recent years, microscopic colitis has been increasingly diagnosed. This review was carried out to evaluate demographic factors for microscopic colitis and to perform a systematic assessment of available treatment options. Relevant publications up to December 2013 were identified following searches of PubMed and Google Scholar using the key words 'microscopic colitis', 'collagenous colitis' and 'lymphocytic colitis'. Two-hundred and forty-eight articles were identified. The term microscopic colitis includes lymphocytic colitis and collagenous colitis. Both have common clinical symptoms but are well defined histopathologically. The clinical course is usually benign, but serious complications, including death, may occur. A peak incidence from 60 to 70 years of age with a female preponderance is observed. Although most cases are idiopathic, associations with autoimmune disorders, such as coeliac disease and hypothyroidism, as well as with exposure to nonsteroidal anti-inflammatory drugs and proton-pump inhibitors, have been observed. The incidence and prevalence of microscopic colitis is rising and good-quality epidemiological research is needed. Treatment is currently largely based on anecdotal evidence and on results from limited clinical trials of budesonide. Long-term follow-up of these patients is not well established. The review synthesizes work on the definition of microscopic colitis and the relationship between collagenous and lymphocytic colitis. It reviews the international epidemiology and work on aetiology. In addition, it critically considers the efficacy of a range of treatments. Colorectal Disease © 2014 The Association of Coloproctology of Great Britain and Ireland.

  17. Nanoscopic oxidation of p-type and un-doped Si (100) surfaces using un-externally biased atomic force microscope tips (AFM) in the presence of selected organic solvents

    Science.gov (United States)

    McCausland, Jeffrey; Withanage, Sajeevi; Mallik, Robert; Lyuksyutov, Sergei

    A conductive un-biased AFM tip oscillating above p-type or un-doped Si (100) treated with toluene, butan-2-ol, and propan-2-ol creates nanostructures ranging in height from 1-100 nm. The tip was oscillated in ambient conditions (30-70% Rel. Humidity) at frequencies in the 102 kHz range. It was repeatable with various concentrations of solvent in aqueous solution. It is suggested that mechanical oscillations of the AFM tip polarizes the solvent molecules deposited on the surface resulting in electron transfer from the tip to the surface followed by feature formation. This process effectively creates an electrochemical cell at the microscopic level and the miscibility of the solvents is the key to enabling the process. Species which ionize during the process may be consumed in irreversible reactions whereas the alcohols act as catalysts and are not consumed. The influence of boron defects in the Si substrates is also discussed. It appears that the observed oxidation is different from all other similar reported phenomena including local anodic oxidation, and chemo-mechanical lithographic techniques utilizing AFM.

  18. Superlensing Microscope Objective Lens

    CERN Document Server

    Yan, Bing; Parker, Alan; Lai, Yukun; Thomas, John; Yue, Liyang; Monks, James

    2016-01-01

    Conventional microscope objective lenses are diffraction limited, which means that they cannot resolve features smaller than half the illumination wavelength. Under white light illumination, such resolution limit is about 250-300 nm for an ordinary microscope. In this paper, we demonstrate a new superlensing objective lens which has a resolution of about 100 nm, offering at least two times resolution improvement over conventional objectives in resolution. This is achieved by integrating a conventional microscope objective lens with a superlensing microsphere lens using a 3D printed lens adaptor. The new objective lens was used for label-free super-resolution imaging of 100 nm-sized engineering and biological samples, including a Blu-ray disc sample, semiconductor chip and adenoviruses. Our work creates a solid base for developing a commercially-viable superlens prototype, which has potential to transform the field of optical microscopy and imaging.

  19. Integrated elastic microscope device

    Science.gov (United States)

    Lee, W. M.; Wright, D.; Watkins, R.; Cen, Zi

    2015-03-01

    The growing power of imaging and computing power of smartphones is creating the possibility of converting your smartphone into a high power pocket microscopy system. High quality miniature microscopy lenses attached to smartphone are typically made with glass or plastics that can only be produce at low cost with high volume. To revise the paradigm of microscope lenses, we devised a simple droplet lens fabrication technique that which produces low cost and high performance lens. Each lens is integrated into thin 3-D printed holder with complimentary light emitted diode (LEDs) that clips onto majority of smartphones. The integrated device converts a smartphone into a high power optical microscope/dermatoscope at around $2. This low cost device has wide application in a multitude of practical uses such as material inspection, dermascope and educational microscope.

  20. Electron microscope studies

    Energy Technology Data Exchange (ETDEWEB)

    Crewe, A.V.; Kapp, O.H.

    1992-07-01

    This is a report covering the research performed in the Crewe laboratory between 1964 and 1992. Because of limitations of space we have provided relatively brief summaries of the major research directions of the facility during these years. A complete bibliography has been included and we have referenced groups of pertinent publications at the beginning of each section. This report summarizes our efforts to develop better electron microscopes and chronicles many of the experimental programs, in materials science and biology, that acted both as a stimulus to better microscope design and also as a testing ground for many instrumental innovations.

  1. Atomic force microscopic comparison of remineralization with casein-phosphopeptide amorphous calcium phosphate paste, acidulated phosphate fluoride gel and iron supplement in primary and permanent teeth: An in-vitro study

    Directory of Open Access Journals (Sweden)

    Nikita Agrawal

    2014-01-01

    Full Text Available Context: Demineralization of tooth by erosion is caused by frequent contact between the tooth surface and acids present in soft drinks. Aim: The present study objective was to evaluate the remineralization potential of casein-phosphopeptide-amorphous calcium phosphate (CPP-ACP paste, 1.23% acidulated phosphate fluoride (APF gel and iron supplement on dental erosion by soft drinks in human primary and permanent enamel using atomic force microscopy (AFM. Materials and Methods: Specimens were made from extracted 15 primary and 15 permanent teeth which were randomly divided into three treatment groups: CPP-ACP paste, APF gel and iron supplement. AFM was used for baseline readings followed by demineralization and remineralization cycle. Results and Statistics: Almost all group of samples showed remineralization that is a reduction in surface roughness which was higher with CPP-ACP paste. Statistical analysis was performed using by one-way ANOVA and Mann-Whitney U-test with P < 0.05. Conclusions: It can be concluded that the application of CPP-ACP paste is effective on preventing dental erosion from soft drinks.

  2. Indentation-formed nanocontacts: an atomic-scale perspective.

    Science.gov (United States)

    Paul, William; Oliver, David; Grütter, Peter

    2014-05-14

    One-to-one comparisons between indentation experiments and atomistic modelling have until recently been hampered by the discrepancy in length scales of the two approaches. Here, we review progress in atomic-scale nanoindentation experiments employing scanning probe techniques to achieve depth-sensing indentation and field ion microscopy to permit detailed indenter characterization. This perspective addresses both mechanical (dislocation nucleation, defect structures, adhesion, indenter effects) and electronic (interface, disorder, and vacancy scattering) properties of indentation-formed contacts.

  3. Microscopic plasma Hamiltonian

    Science.gov (United States)

    Peng, Y.-K. M.

    1974-01-01

    A Hamiltonian for the microscopic plasma model is derived from the Low Lagrangian after the dual roles of the generalized variables are taken into account. The resulting Hamilton equations are shown to agree with the Euler-Lagrange equations of the Low Lagrangian.

  4. Microscope on Mars

    Science.gov (United States)

    2004-01-01

    This image taken at Meridiani Planum, Mars by the panoramic camera on the Mars Exploration Rover Opportunity shows the rover's microscopic imager (circular device in center), located on its instrument deployment device, or 'arm.' The image was acquired on the ninth martian day or sol of the rover's mission.

  5. Microscope on Mars

    Science.gov (United States)

    2004-01-01

    This image taken at Meridiani Planum, Mars by the panoramic camera on the Mars Exploration Rover Opportunity shows the rover's microscopic imager (circular device in center), located on its instrument deployment device, or 'arm.' The image was acquired on the ninth martian day or sol of the rover's mission.

  6. Comparison of DC and AC Transport in 1.5-7.5 nm Oligophenylene Imine Molecular Wires across Two Junction Platforms: Eutectic Ga-In versus Conducting Probe Atomic Force Microscope Junctions.

    Science.gov (United States)

    Sangeeth, C S Suchand; Demissie, Abel T; Yuan, Li; Wang, Tao; Frisbie, C Daniel; Nijhuis, Christian A

    2016-06-15

    We have utilized DC and AC transport measurements to measure the resistance and capacitance of thin films of conjugated oligophenyleneimine (OPI) molecules ranging from 1.5 to 7.5 nm in length. These films were synthesized on Au surfaces utilizing the imine condensation chemistry between terephthalaldehyde and 1,4-benzenediamine. Near edge X-ray absorption fine structure (NEXAFS) spectroscopy yielded molecular tilt angles of 33-43°. To probe DC and AC transport, we employed Au-S-OPI//GaOx/EGaIn junctions having contact areas of 9.6 × 10(2) μm(2) (10(9) nm(2)) and compared to previously reported DC results on the same OPI system obtained using Au-S-OPI//Au conducting probe atomic force microscopy (CP-AFM) junctions with 50 nm(2) areas. We found that intensive observables agreed very well across the two junction platforms. Specifically, the EGaIn-based junctions showed: (i) a crossover from tunneling to hopping transport at molecular lengths near 4 nm; (ii) activated transport for wires >4 nm in length with an activation energy of 0.245 ± 0.008 eV for OPI-7; (iii) exponential dependence of conductance with molecular length with a decay constant β = 2.84 ± 0.18 nm(-1) (DC) and 2.92 ± 0.13 nm(-1) (AC) in the tunneling regime, and an apparent β = 1.01 ± 0.08 nm(-1) (DC) and 0.99 ± 0.11 nm(-1) (AC) in the hopping regime; (iv) previously unreported dielectric constant of 4.3 ± 0.2 along the OPI wires. However, the absolute resistances of Au-S-OPI//GaOx/EGaIn junctions were approximately 100 times higher than the corresponding CP-AFM junctions due to differences in metal-molecule contact resistances between the two platforms.

  7. Ultra-precise holographic beam shaping for microscopic quantum control

    OpenAIRE

    Zupancic, Philip; Preiss, Philipp M.; Ma, Ruichao; Lukin, Alexander; Tai, M. Eric; Rispoli, Matthew; Islam, Rajibul; Greiner, Markus

    2016-01-01

    High-resolution addressing of individual ultracold atoms, trapped ions or solid state emitters allows for exquisite control in quantum optics experiments. This becomes possible through large aperture magnifying optics that project microscopic light patterns with diffraction limited performance. We use programmable amplitude holograms generated on a digital micromirror device to create arbitrary microscopic beam shapes with full phase and amplitude control. The system self-corrects for aberrat...

  8. Microscopic theory of photonic band gaps in optical lattices

    CERN Document Server

    Samoylova, M; Bachelard, R; Courteille, Ph W

    2013-01-01

    We propose a microscopic model to describe the scattering of light by atoms in optical lattices. The model is shown to efficiently capture Bragg scattering, spontaneous emission and photonic band gaps. A connection to the transfer matrix formalism is established in the limit of a one-dimensional optical lattice, and we find the two theories to yield results in good agreement. The advantage of the microscopic model is, however, that it suits better for studies of finite-size and disorder effects.

  9. Designs for a quantum electron microscope

    Energy Technology Data Exchange (ETDEWEB)

    Kruit, P., E-mail: p.kruit@tudelft.nl [Department of Imaging Physics, Delft University of Technology, Lorentzweg 1, 2628CJ Delft (Netherlands); Hobbs, R.G.; Kim, C-S.; Yang, Y.; Manfrinato, V.R. [Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139 (United States); Hammer, J.; Thomas, S.; Weber, P. [Department of Physics, Friedrich Alexander University Erlangen-Nürnberg (FAU), Staudtstrasse 1, d-91058 Erlangen (Germany); Klopfer, B.; Kohstall, C.; Juffmann, T.; Kasevich, M.A. [Department of Physics, Stanford University, Stanford, California 94305 (United States); Hommelhoff, P. [Department of Physics, Friedrich Alexander University Erlangen-Nürnberg (FAU), Staudtstrasse 1, d-91058 Erlangen (Germany); Berggren, K.K. [Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139 (United States)

    2016-05-15

    One of the astounding consequences of quantum mechanics is that it allows the detection of a target using an incident probe, with only a low probability of interaction of the probe and the target. This ‘quantum weirdness’ could be applied in the field of electron microscopy to generate images of beam-sensitive specimens with substantially reduced damage to the specimen. A reduction of beam-induced damage to specimens is especially of great importance if it can enable imaging of biological specimens with atomic resolution. Following a recent suggestion that interaction-free measurements are possible with electrons, we now analyze the difficulties of actually building an atomic resolution interaction-free electron microscope, or “quantum electron microscope”. A quantum electron microscope would require a number of unique components not found in conventional transmission electron microscopes. These components include a coherent electron beam-splitter or two-state-coupler, and a resonator structure to allow each electron to interrogate the specimen multiple times, thus supporting high success probabilities for interaction-free detection of the specimen. Different system designs are presented here, which are based on four different choices of two-state-couplers: a thin crystal, a grating mirror, a standing light wave and an electro-dynamical pseudopotential. Challenges for the detailed electron optical design are identified as future directions for development. While it is concluded that it should be possible to build an atomic resolution quantum electron microscope, we have also identified a number of hurdles to the development of such a microscope and further theoretical investigations that will be required to enable a complete interpretation of the images produced by such a microscope. - Highlights: • Quantum electron microscopy has the potential of reducing radiation damage. • QEM requires a fraction of the electron wave to pass through the sample

  10. Atomic force microscopy and scanning electron microscopic study on the fluorosis of enamel in rats%氟影响大鼠牙釉质发育的扫描电镜和原子力显微镜观察

    Institute of Scientific and Technical Information of China (English)

    陈黎明; 汤晔; 唐杰

    2015-01-01

    Objective To investigate the ultrastructure of enamel in the mandibular incisor tooth in a rat model of dental fluorosis.Methods Thirty 5-week-old male and female rats of SD strain were divided into three groups of ten.The animals in the control group were maintained for 8 weeks on pure deionized water,in the low-fluoride group deionized water with 22.5 mg/L of fluorine(50 mg/L NaF) was used,and in the high-fluoride group deionized water with 45 mg/L of fluorine(100 mg/L NaF) was used.All specimens examined were obtained from the mandibular incisors.Mid-sagittal ground sections were prepared from the direction of incisal point of each incisor for scanning electron microscopy(SEM) and atomic force microscopy (AFM).Results According to the SEM results,the prisms in the control group had a complete and clear column structure with closely packed enamel rods or enamel prisms.The prisms in the high-fluoride experimental group were collapsed and showed curved and fractured crystallites.The level of prism structural changes in the low-fluoride experimental group was in between that of the control group and the high-fluoride group.AFM for the middle layer enamel showed an average roughness(Ra) of (550.6±32.0) nm in the control group,(415.0±24.2) nm in the low-fluoride group,and (194.3± 11.3) nm for the high-fluoride group.There was significant difference between the high-fluoride group and the control group(P<0.05).Conclusions Formation of rat enamel in the high fluoride environment presented obvious structural collapse and no clearance between prisms.Such changes appear to indicate a loss of normal prism structure in rat enamels from exposure to high levels of fluorine during the maturation period.%目的 观察大鼠氟斑牙模型下颌切牙釉质的超微结构,探讨过量氟对牙体微观结构的影响.方法 30只5周龄SD大鼠雌雄各半,均分为3组,对照组用不含氟的去离子水喂养,低氟组用含22.5 mg/L F-(50 mg/L NaF)、高氟组用含45 mg

  11. The atomic and molecular reaction statics

    Institute of Scientific and Technical Information of China (English)

    ZHU; ZhengHe

    2007-01-01

    This work presents a new science called atomic and molecular reaction statics (AMRS). There are four parts for AMRS, i.e. the group theoretical derivation of molecular electronic states, the principle of microscopic reversibility, the principle of microscopic transitivity and the optimum energy process rule. AMRS has been developed for about twenty years.

  12. Mechanochemistry Induced Using Force Exerted by a Functionalized Microscope Tip

    DEFF Research Database (Denmark)

    Zhang, Yajie; Wang, Yongfeng; Lü, Jing-Tao

    2017-01-01

    Atomic-scale mechanochemistry is realized from force exerted by a C60 -functionalized scanning tunneling microscope tip. Two conformers of tin phthalocyanine can be prepared on coinage-metal surfaces. A transition between these conformers is induced on Cu(111) and Ag(100). Density-functional calc......Atomic-scale mechanochemistry is realized from force exerted by a C60 -functionalized scanning tunneling microscope tip. Two conformers of tin phthalocyanine can be prepared on coinage-metal surfaces. A transition between these conformers is induced on Cu(111) and Ag(100). Density...

  13. Anisotropic Contrast Optical Microscope

    CERN Document Server

    Peev, D; Kananizadeh, N; Wimer, S; Rodenhausen, K B; Herzinger, C M; Kasputis, T; Pfaunmiller, E; Nguyen, A; Korlacki, R; Pannier, A; Li, Y; Schubert, E; Hage, D; Schubert, M

    2016-01-01

    An optical microscope is described that reveals contrast in the Mueller matrix images of a thin, transparent or semi-transparent specimen located within an anisotropic object plane (anisotropic filter). The specimen changes the anisotropy of the filter and thereby produces contrast within the Mueller matrix images. Here we use an anisotropic filter composed of a semi-transparent, nanostructured thin film with sub-wavelength thickness placed within the object plane. The sample is illuminated as in common optical microscopy but the light is modulated in its polarization using combinations of linear polarizers and phase plate (compensator) to control and analyze the state of polarization. Direct generalized ellipsometry data analysis approaches permit extraction of fundamental Mueller matrix object plane images dispensing with the need of Fourier expansion methods. Generalized ellipsometry model approaches are used for quantitative image analyses. We demonstrate the anisotropic contrast optical microscope by mea...

  14. Microscopic Halftone Image Segmentation

    Institute of Scientific and Technical Information of China (English)

    WANG Yong-gang; YANG Jie; DING Yong-sheng

    2004-01-01

    Microscopic halftone image recognition and analysis can provide quantitative evidence for printing quality control and fault diagnosis of printing devices, while halftone image segmentation is one of the significant steps during the procedure. Automatic segmentation on microscopic dots by the aid of the Fuzzy C-Means (FCM) method that takes account of the fuzziness of halftone image and utilizes its color information adequately is realized. Then some examples show the technique effective and simple with better performance of noise immunity than some usual methods. In addition, the segmentation results obtained by the FCM in different color spaces are compared, which indicates that the method using the FCM in the f1f2f3 color space is superior to the rest.

  15. Graphene control cutting using an atomic force microscope based nanorobot%基于原子力显微镜的石墨烯可控裁剪方法研究

    Institute of Scientific and Technical Information of China (English)

    张嵛; 刘连庆; 席宁; 王越超; 董再励

    2012-01-01

    石墨烯是一种新奇的纳米材料,其电学特性与几何构型密切相关,因此特定几何构型的加工技术是石墨烯基纳米器件走入实际应用的关键.然而迄今为止,还没有能够快速、低成本实现上述目标的方法.本文提出了一种基于原子力显微镜(AFM)机械切割的石墨烯裁剪方法,实现了各种石墨烯纳米结构如纳米带、三角形等的可控加工;探索了载荷与裁剪效果之间的关系,同时结合旋转基底法实现了AFM针尖效应对切割力检测影响的有效克服,在理论和实验上系统研究了晶格切割方向对纳米切割力大小的影响.本研究表明实时切割力可以作为纳米加工过程的状态反馈信息来指引纳米切割的进行,这为实现晶格精度的石墨烯可控加工奠定了理论与实验基础,由于该方法还具有与并行探针相兼容的优点,因此有望在规模化、批量化、低成本的石墨烯基纳米器件制造中发挥重要作用.%The electrical properties of graphene strongly rely on its size, geometry and edge structure. Therefore, the ability of fabricaiing graphene into desired configuration is one of the enabled techniques to manufacture graphene-based nanodevices and push ii into practical applications. However, there is no effective way to achieve this goal till today. In this paper, an Atomic Force Microscopy (AFM) based mechanical cutting method is developed to meet the urgent need of graphene fabrication. Theoretical analysis between cutting force and lattice cutting angle is carried out, which reveals that the value of the cutting force is related with the graphene cutting direction. Different graphene shapes are fabricated to demonstrate the efficiency and effectiveness of the proposed method. Furthermore, after many times of cutting experiments with the rotation sample method, we proved that the cutting forces do vary with the lattice cutting direction. The experimental results keep consistent

  16. Color Laser Microscope

    Science.gov (United States)

    Awamura, D.; Ode, T.; Yonezawa, M.

    1987-04-01

    A color laser microscope utilizing a new color laser imaging system has been developed for the visual inspection of semiconductors. The light source, produced by three lasers (Red; He-Ne, Green; Ar, Blue; He-Cd), is deflected horizontally by an AOD (Acoustic Optical Deflector) and vertically by a vibration mirror. The laser beam is focused in a small spot which is scanned over the sample at high speed. The light reflected back from the sample is reformed to contain linear information by returning to the original vibration mirror. The linear light is guided to the CCD image sensor where it is converted into a video signal. Individual CCD image sensors are used for each of the three R, G, or B color image signals. The confocal optical system with its laser light source yields a color TV monitor image with no flaring and a much sharper resolution than that of the conventional optical microscope. The AOD makes possible a high speed laser scan and a NTSC or PAL TV video signal is produced in real time without any video memory. Since the light source is composed of R, G, and B laser beams, color separation superior to that of white light illumination is achieved. Because of the photometric linearity of the image detector, the R, G, and B outputs of the system are most suitably used for hue analysis. The CCD linear image sensors in the optical system produce no geometrical distortion, and good color registration is available principally. The output signal can be used for high accuracy line width measuring. The many features of the color laser microscope make it ideally suited for the visual inspection of semiconductor processing. A number of these systems have already been installed in such a capacity. The Color Laser Microscope can also be a very useful tool for the fields of material engineering and biotechnology.

  17. Microscopic enteritis: Bucharest consensus.

    Science.gov (United States)

    Rostami, Kamran; Aldulaimi, David; Holmes, Geoffrey; Johnson, Matt W; Robert, Marie; Srivastava, Amitabh; Fléjou, Jean-François; Sanders, David S; Volta, Umberto; Derakhshan, Mohammad H; Going, James J; Becheanu, Gabriel; Catassi, Carlo; Danciu, Mihai; Materacki, Luke; Ghafarzadegan, Kamran; Ishaq, Sauid; Rostami-Nejad, Mohammad; Peña, A Salvador; Bassotti, Gabrio; Marsh, Michael N; Villanacci, Vincenzo

    2015-03-07

    Microscopic enteritis (ME) is an inflammatory condition of the small bowel that leads to gastrointestinal symptoms, nutrient and micronutrient deficiency. It is characterised by microscopic or sub-microscopic abnormalities such as microvillus changes and enterocytic alterations in the absence of definite macroscopic changes using standard modern endoscopy. This work recognises a need to characterize disorders with microscopic and submicroscopic features, currently regarded as functional or non-specific entities, to obtain further understanding of their clinical relevance. The consensus working party reviewed statements about the aetiology, diagnosis and symptoms associated with ME and proposes an algorithm for its investigation and treatment. Following the 5(th) International Course in Digestive Pathology in Bucharest in November 2012, an international group of 21 interested pathologists and gastroenterologists formed a working party with a view to formulating a consensus statement on ME. A five-step agreement scale (from strong agreement to strong disagreement) was used to score 21 statements, independently. There was strong agreement on all statements about ME histology (95%-100%). Statements concerning diagnosis achieved 85% to 100% agreement. A statement on the management of ME elicited agreement from the lowest rate (60%) up to 100%. The remaining two categories showed general agreement between experts on clinical presentation (75%-95%) and pathogenesis (80%-90%) of ME. There was strong agreement on the histological definition of ME. Weaker agreement on management indicates a need for further investigations, better definitions and clinical trials to produce quality guidelines for management. This ME consensus is a step toward greater recognition of a significant entity affecting symptomatic patients previously labelled as non-specific or functional enteropathy.

  18. Virtual pinhole confocal microscope

    Energy Technology Data Exchange (ETDEWEB)

    George, J.S.; Rector, D.M.; Ranken, D.M. [Los Alamos National Lab., NM (United States). Biophysics Group; Peterson, B. [SciLearn Inc. (United States); Kesteron, J. [VayTech Inc. (United States)

    1999-06-01

    Scanned confocal microscopes enhance imaging capabilities, providing improved contrast and image resolution in 3-D, but existing systems have significant technical shortcomings and are expensive. Researchers at Los Alamos National Laboratory have developed a novel approach--virtual pinhole confocal microscopy--that uses state of the art illumination, detection, and data processing technologies to produce an imager with a number of advantages: reduced cost, faster imaging, improved efficiency and sensitivity, improved reliability and much greater flexibility. Work at Los Alamos demonstrated proof of principle; prototype hardware and software have been used to demonstrate technical feasibility of several implementation strategies. The system uses high performance illumination, patterned in time and space. The authors have built functional confocal imagers using video display technologies (LCD or DLP) and novel scanner based on a micro-lens array. They have developed a prototype system for high performance data acquisition and processing, designed to support realtime confocal imaging. They have developed algorithms to reconstruct confocal images from a time series of spatially sub-sampled images; software development remains an area of active development. These advances allow the collection of high quality confocal images (in fluorescence, reflectance and transmission modes) with equipment that can inexpensively retrofit to existing microscopes. Planned future extensions to these technologies will significantly enhance capabilities for microscopic imaging in a variety of applications, including confocal endoscopy, and confocal spectral imaging.

  19. Thimble microscope system

    Science.gov (United States)

    Kamal, Tahseen; Rubinstein, Jaden; Watkins, Rachel; Cen, Zijian; Kong, Gary; Lee, W. M.

    2016-12-01

    Wearable computing devices, e.g. Google Glass, Smart watch, embodies the new human design frontier, where technology interfaces seamlessly with human gestures. During examination of any subject in the field (clinic, surgery, agriculture, field survey, water collection), our sensory peripherals (touch and vision) often go hand-in-hand. The sensitivity and maneuverability of the human fingers are guided with tight distribution of biological nerve cells, which perform fine motor manipulation over a range of complex surfaces that is often out of sight. Our sight (or naked vision), on the other hand, is generally restricted to line of sight that is ill-suited to view around corner. Hence, conventional imaging methods are often resort to complex light guide designs (periscope, endoscopes etc) to navigate over obstructed surfaces. Using modular design strategies, we constructed a prototype miniature microscope system that is incorporated onto a wearable fixture (thimble). This unique platform allows users to maneuver around a sample and take high resolution microscopic images. In this paper, we provide an exposition of methods to achieve a thimble microscopy; microscope lens fabrication, thimble design, integration of miniature camera and liquid crystal display.

  20. Schematic Animation of Phoenix's Microscope Station

    Science.gov (United States)

    2008-01-01

    [figure removed for brevity, see original site] Click on image for animation This animation shows the workings of the microscope station of the Microscopy, Electrochemistry and Conductivity Analyzer (MECA) instrument suite of NASA's Phoenix Mars Lander. Samples are delivered to the horizontal portion of the sample wheel (yellow) that pokes outside an opening in the box enclosure. The wheel rotates to present the sample to the microscopes. The Optical Microscope (red) can see particles a little smaller than one-tenth the diameter of a human hair. The Atomic Force Microscope (pink) can see particles forty time smaller. The samples are on a variety of substrate surfaces, the small circles on the beveled edge of the sample wheel. For scale, the diameter of the wheel is about 14 centimeters (5.5 inches). Each substrate is a circle 3 millimeters (0.1 inch) in diameter. The Phoenix Mission is led by the University of Arizona, Tucson, on behalf of NASA. Project management of the mission is by NASA's Jet Propulsion Laboratory, Pasadena, Calif. Spacecraft development is by Lockheed Martin Space Systems, Denver.

  1. Atomic force fluorescence microscopy : combining the best of two worlds

    NARCIS (Netherlands)

    Kassies, Roelf

    2005-01-01

    The complementary strengths and weaknesses of AFM and optical microscopy leads to the desire to integrate both techniques into a single microscope. This thesis describes the development of a com-bined AFM / confocal °uorescence microscope. This atomic force °uorescence microscope (AFFM) combines hig

  2. Microscopic computation in human brain evolution.

    Science.gov (United States)

    Wallace, R

    1995-04-01

    When human psychological performance is viewed in terms of cognitive modules, our species displays remarkable differences in computational power. Algorithmically simple computations are generally difficult to perform, whereas optimal routing or "Traveling Salesman" Problems (TSP) of far greater complexity are solved on an everyday basis. It is argued that even "simple" instances of TSP are not purely Euclidian problems in human computations, but involve emotional, autonomic, and cognitive constraints. They therefore require a level of parallel processing not possible in a macroscopic system to complete the algorithm within a brief period of time. A microscopic neurobiological model emphasizing the computational power of excited atoms within the neuronal membrane is presented as an alternative to classical connectionist approaches. The evolution of the system is viewed in terms of specific natural selection pressures driving satisfying computations toward global optimization. The relationship of microscopic computation to the nature of consciousness is examined, and possible mathematical models as a basis for simulation studies are briefly discussed.

  3. Coffee Cup Atomic Force Microscopy

    Science.gov (United States)

    Ashkenaz, David E.; Hall, W. Paige; Haynes, Christy L.; Hicks, Erin M.; McFarland, Adam D.; Sherry, Leif J.; Stuart, Douglas A.; Wheeler, Korin E.; Yonzon, Chanda R.; Zhao, Jing; Godwin, Hilary A.; Van Duyne, Richard P.

    2010-01-01

    In this activity, students use a model created from a coffee cup or cardstock cutout to explore the working principle of an atomic force microscope (AFM). Students manipulate a model of an AFM, using it to examine various objects to retrieve topographic data and then graph and interpret results. The students observe that movement of the AFM…

  4. Coffee Cup Atomic Force Microscopy

    Science.gov (United States)

    Ashkenaz, David E.; Hall, W. Paige; Haynes, Christy L.; Hicks, Erin M.; McFarland, Adam D.; Sherry, Leif J.; Stuart, Douglas A.; Wheeler, Korin E.; Yonzon, Chanda R.; Zhao, Jing; Godwin, Hilary A.; Van Duyne, Richard P.

    2010-01-01

    In this activity, students use a model created from a coffee cup or cardstock cutout to explore the working principle of an atomic force microscope (AFM). Students manipulate a model of an AFM, using it to examine various objects to retrieve topographic data and then graph and interpret results. The students observe that movement of the AFM…

  5. Nanosecond electron microscopes

    Science.gov (United States)

    Bostanjoglo; Elschner; Mao; Nink; Weingartner

    2000-04-01

    Combining electron optics, fast electronics and pulsed lasers, a transmission and a photoelectron emission microscope were built, which visualize events in thin films and on surfaces with a time resolution of several nanoseconds. The high-speed electron microscopy is capable to track fast laser-induced processes in metals below the ablation threshold, which are difficult to detect by other imaging techniques. The material response to nano- and femtosecond laser pulses was found to be very different. It was dominated by thermo/chemocapillary flow and chemical reactions in the case of nanosecond pulses, and by mechanical deformations and non-thermal electron emission after a femtosecond pulse.

  6. Templates for Deposition of Microscopic Pointed Structures

    Science.gov (United States)

    Pugel, Diane E.

    2008-01-01

    Templates for fabricating sharply pointed microscopic peaks arranged in nearly regular planar arrays can be fabricated by a relatively inexpensive technique that has recently been demonstrated. Depending on the intended application, a semiconducting, insulating, or metallic film could be deposited on such a template by sputtering, thermal evaporation, pulsed laser deposition, or any other suitable conventional deposition technique. Pointed structures fabricated by use of these techniques may prove useful as photocathodes or field emitters in plasma television screens. Selected peaks could be removed from such structures and used individually as scanning tips in atomic force microscopy or mechanical surface profiling.

  7. Atomic energy

    CERN Multimedia

    1996-01-01

    Interviews following the 1991 co-operation Agreement between the Department of Atomic Energy (DAE) of the Government of India and the European Organization for Nuclear Research (CERN) concerning the participation in the Large Hadron Collider Project (LHC) . With Chidambaram, R, Chairman, Atomic Energy Commission and Secretary, Department of Atomic Energy, Department of Atomic Energy (DAE) of the Government of India and Professor Llewellyn-Smith, Christopher H, Director-General, CERN.

  8. Atom chips

    CERN Document Server

    Reichel, Jakob

    2010-01-01

    This book provides a stimulating and multifaceted picture of a rapidly developing field. The first part reviews fundamentals of atom chip research in tutorial style, while subsequent parts focus on the topics of atom-surface interaction, coherence on atom chips, and possible future directions of atom chip research. The articles are written by leading researchers in the field in their characteristic and individual styles.

  9. Electron microscope phase enhancement

    Science.gov (United States)

    Jin, Jian; Glaeser, Robert M.

    2010-06-15

    A microfabricated electron phase shift element is used for modifying the phase characteristics of an electron beam passing though its center aperture, while not affecting the more divergent portion of an incident beam to selectively provide a ninety-degree phase shift to the unscattered beam in the back focal plan of the objective lens, in order to realize Zernike-type, in-focus phase contrast in an electron microscope. One application of the element is to increase the contrast of an electron microscope for viewing weakly scattering samples while in focus. Typical weakly scattering samples include biological samples such as macromolecules, or perhaps cells. Preliminary experimental images demonstrate that these devices do apply a ninety degree phase shift as expected. Electrostatic calculations have been used to determine that fringing fields in the region of the scattered electron beams will cause a negligible phase shift as long as the ratio of electrode length to the transverse feature-size aperture is about 5:1. Calculations are underway to determine the feasibility of aspect smaller aspect ratios of about 3:1 and about 2:1.

  10. Forensic Scanning Electron Microscope

    Science.gov (United States)

    Keeley, R. H.

    1983-03-01

    The scanning electron microscope equipped with an x-ray spectrometer is a versatile instrument which has many uses in the investigation of crime and preparation of scientific evidence for the courts. Major applications include microscopy and analysis of very small fragments of paint, glass and other materials which may link an individual with a scene of crime, identification of firearms residues and examination of questioned documents. Although simultaneous observation and chemical analysis of the sample is the most important feature of the instrument, other modes of operation such as cathodoluminescence spectrometry, backscattered electron imaging and direct x-ray excitation are also exploited. Marks on two bullets or cartridge cases can be compared directly by sequential scanning with a single beam or electronic linkage of two instruments. Particles of primer residue deposited on the skin and clothing when a gun is fired can be collected on adhesive tape and identified by their morphology and elemental composition. It is also possible to differentiate between the primer residues of different types of ammunition. Bullets may be identified from the small fragments left behind as they pass through the body tissues. In the examination of questioned documents the scanning electron microscope is used to establish the order in which two intersecting ink lines were written and to detect traces of chemical markers added to the security inks on official documents.

  11. Simple Activities to Improve Students' Understanding of Microscopic Friction

    Science.gov (United States)

    Corpuz, Edgar de Guzman; Rebello, N. Sanjay

    2012-01-01

    We are currently on the verge of several breakthroughs in nanoscience and technology, and we need to prepare our citizenry to be scientifically literate about the microscopic world. Previous research shows that students' mental models of friction at the atomic level are significantly influenced by their macroscopic ideas. Most students see…

  12. Structure Identification in High-Resolution Transmission Electron Microscopic Images

    DEFF Research Database (Denmark)

    Vestergaard, Jacob Schack; Kling, Jens; Dahl, Anders Bjorholm

    2014-01-01

    A connection between microscopic structure and macroscopic properties is expected for almost all material systems. High-resolution transmission electron microscopy is a technique offering insight into the atomic structure, but the analysis of large image series can be time consuming. The present ...

  13. Atomic polarizabilities

    Energy Technology Data Exchange (ETDEWEB)

    Safronova, M. S. [Department of Physics and Astronomy, University of Delaware, Newark, DE 19716 (United States); Mitroy, J. [School of Engineering, Charles Darwin University, Darwin NT 0909 (Australia); Clark, Charles W. [Joint Quantum Institute, National Institute of Standards and Technology and the University of Maryland, Gaithersburg, Maryland 20899-8410 (United States); Kozlov, M. G. [Petersburg Nuclear Physics Institute, Gatchina 188300 (Russian Federation)

    2015-01-22

    The atomic dipole polarizability governs the first-order response of an atom to an applied electric field. Atomic polarization phenomena impinge upon a number of areas and processes in physics and have been the subject of considerable interest and heightened importance in recent years. In this paper, we will summarize some of the recent applications of atomic polarizability studies. A summary of results for polarizabilities of noble gases, monovalent, and divalent atoms is given. The development of the CI+all-order method that combines configuration interaction and linearized coupled-cluster approaches is discussed.

  14. Anisotropic contrast optical microscope

    Science.gov (United States)

    Peev, D.; Hofmann, T.; Kananizadeh, N.; Beeram, S.; Rodriguez, E.; Wimer, S.; Rodenhausen, K. B.; Herzinger, C. M.; Kasputis, T.; Pfaunmiller, E.; Nguyen, A.; Korlacki, R.; Pannier, A.; Li, Y.; Schubert, E.; Hage, D.; Schubert, M.

    2016-11-01

    An optical microscope is described that reveals contrast in the Mueller matrix images of a thin, transparent, or semi-transparent specimen located within an anisotropic object plane (anisotropic filter). The specimen changes the anisotropy of the filter and thereby produces contrast within the Mueller matrix images. Here we use an anisotropic filter composed of a semi-transparent, nanostructured thin film with sub-wavelength thickness placed within the object plane. The sample is illuminated as in common optical microscopy but the light is modulated in its polarization using combinations of linear polarizers and phase plate (compensator) to control and analyze the state of polarization. Direct generalized ellipsometry data analysis approaches permit extraction of fundamental Mueller matrix object plane images dispensing with the need of Fourier expansion methods. Generalized ellipsometry model approaches are used for quantitative image analyses. These images are obtained from sets of multiple images obtained under various polarizer, analyzer, and compensator settings. Up to 16 independent Mueller matrix images can be obtained, while our current setup is limited to 11 images normalized by the unpolarized intensity. We demonstrate the anisotropic contrast optical microscope by measuring lithographically defined micro-patterned anisotropic filters, and we quantify the adsorption of an organic self-assembled monolayer film onto the anisotropic filter. Comparison with an isotropic glass slide demonstrates the image enhancement obtained by our method over microscopy without the use of an anisotropic filter. In our current instrument, we estimate the limit of detection for organic volumetric mass within the object plane of ≈49 fg within ≈7 × 7 μm2 object surface area. Compared to a quartz crystal microbalance with dissipation instrumentation, where contemporary limits require a total load of ≈500 pg for detection, the instrumentation demonstrated here improves

  15. Microscopic Characterization of Scalable Coherent Rydberg Superatoms

    Directory of Open Access Journals (Sweden)

    Johannes Zeiher

    2015-08-01

    Full Text Available Strong interactions can amplify quantum effects such that they become important on macroscopic scales. Controlling these coherently on a single-particle level is essential for the tailored preparation of strongly correlated quantum systems and opens up new prospects for quantum technologies. Rydberg atoms offer such strong interactions, which lead to extreme nonlinearities in laser-coupled atomic ensembles. As a result, multiple excitation of a micrometer-sized cloud can be blocked while the light-matter coupling becomes collectively enhanced. The resulting two-level system, often called a “superatom,” is a valuable resource for quantum information, providing a collective qubit. Here, we report on the preparation of 2 orders of magnitude scalable superatoms utilizing the large interaction strength provided by Rydberg atoms combined with precise control of an ensemble of ultracold atoms in an optical lattice. The latter is achieved with sub-shot-noise precision by local manipulation of a two-dimensional Mott insulator. We microscopically confirm the superatom picture by in situ detection of the Rydberg excitations and observe the characteristic square-root scaling of the optical coupling with the number of atoms. Enabled by the full control over the atomic sample, including the motional degrees of freedom, we infer the overlap of the produced many-body state with a W state from the observed Rabi oscillations and deduce the presence of entanglement. Finally, we investigate the breakdown of the superatom picture when two Rydberg excitations are present in the system, which leads to dephasing and a loss of coherence.

  16. Development and Applications for the Remote Controllable Atomic Force Microscope

    Science.gov (United States)

    Fornaro, P.; Guggisberg, M.; Gyalog, T.; Wattinger, Ch.; Meyer, E.; Güntherodt, H.-J.

    2003-12-01

    We present a fully remote controllable AFM, featuring a motorized four-axis sample stage. The low cost robotics allows a fast and accurate change of pre-defined positions. Due to the software interface the instrument can be programmed to perform sequences of measurements. This allows the automated acquisition of large scale high resolution images. The instrument can be controlled and monitored from various locations using a standard network interface.

  17. Large dynamic range Atomic Force Microscope for overlay improvements

    NARCIS (Netherlands)

    Kuiper, S.; Fritz, E.C.; Crowcombe, W.E.; Liebig, T.; Kramer, G.F.I.; Witvoet, G.; Duivenvoorde, T.; Overtoom, A.J.; Rijnbeek, R.A.; Zwet, E.J. van; Dijsseldonk, A. van; Boef, A. den; Beems, M.; Levasier, L.

    2016-01-01

    Nowadays most overlay metrology tools assess the overlay performance based on marker features which are deposited next to the functional device features within each layer of the semiconductor device. However, correct overlay of the relatively coarse marker features does not directly guarantee correc

  18. Higher Harmonics Generation in Tapping Mode Atomic Force Microscope

    Institute of Scientific and Technical Information of China (English)

    LI Yuan; QIAN Jian-Qiang

    2009-01-01

    The contribution of higher harmonics to the movement of a micro rectangular cantilever in tapping mode AFM is investigated. The dependence between the phase lag of the higher harmonic components and tip-sample separation are found to be an order of magnitude higher than the base one, reflecting an increasing sensitivity to local variations of surface properties compared to the normal phase signal.The strong correlation between the higher harmonic amplitude and average sample deformation implies that the higher harmonic amplitude can be taken to monitor the tapping force or as feedback variable to fulfill a constant repulsive force mode.

  19. In situ atomic force microscope imaging of supported lipid bilayers

    DEFF Research Database (Denmark)

    Kaasgaard, Thomas; Leidy, Chad; Ipsen, John Hjorth

    2001-01-01

    In situ AFM images of phospholipase A/sub 2/ (PLA/sub 2/) hydrolysis of mica-supported one- and two-component lipid bilayers are presented. For one-component DPPC bilayers an enhanced enzymatic activity is observed towards preexisting defects in the bilayer. Phase separation is observed in two......-component DMPC-DSPC bilayers and a remarkable enhanced hydrolytic activity of the PLA/sub 2/-enzyme for the DMPC-rich phase is seen. Furthermore, in a supported double bilayer system a characteristic ripple structure, most likely related to the formation of the P/sub beta /-ripple phase is observed....

  20. The Atomic Force Microscopic (AFM) Characterization of Nanomaterials

    Science.gov (United States)

    2009-06-01

    solvents for SWNTs dispersion. In his report, SWNTs were prepared with the pulsed laser vaporization ( laser ablation ) method and purified by HNO3. The...Minutes; c) 90 Minutes; d) 120 Minutes, Respectively 4.2 Ball Milling and Dispersion of XD Carbon Nanotubes (XDCNTs) and Tungsten Carbide (WC...1,1,1-Trichloroethane TEM Transition Electron Microscopy TPa Terapascal V Volt W Watt w/w Weight by Weight WC Tungsten Carbide XDCNT XD Carbon

  1. Atomic force microscope infrared spectroscopy of griseofulvin nanocrystals

    Science.gov (United States)

    Harrison, A. J.; Bilgili, E. A.; Beaudoin, S. P.

    2013-01-01

    The goal of this work was to evaluate the ability of photothermal induced resonance (PTIR) to measure the local infrared absorption spectra of crystalline organic drug nanoparticles embedded within solid matrices. Herein, the first reports of the chemical characterization of sub-100 nm organic crystals are described; infrared spectra of 90 nm griseofulvin particles were obtained, confirming the chemical resolution of PTIR beyond the diffraction limit. Additionally, particle size distributions via dynamic light scattering and PTIR image analysis were found to be similar, suggesting that the PTIR measurements are not significantly affected by inhomogeneous infrared absorptivity of this system. Thus as medical applications increasingly emphasize localized drug delivery via micro/nano-engineered structures, PTIR can be used to unambiguously chemically characterize drug formulations at these length scales. PMID:24171582

  2. Atomic Force Microscope 2: Digital Instruments/Veeco Dimension 3000

    Data.gov (United States)

    Federal Laboratory Consortium — Description:CORAL Name: AFM 2A tool used to study the material surface characteristics, check the surface patterns generated by nanofabrication. It can take samples...

  3. Imaging arrangement and microscope

    Science.gov (United States)

    Pertsinidis, Alexandros; Chu, Steven

    2015-12-15

    An embodiment of the present invention is an imaging arrangement that includes imaging optics, a fiducial light source, and a control system. In operation, the imaging optics separate light into first and second tight by wavelength and project the first and second light onto first and second areas within first and second detector regions, respectively. The imaging optics separate fiducial light from the fiducial light source into first and second fiducial light and project the first and second fiducial light onto third and fourth areas within the first and second detector regions, respectively. The control system adjusts alignment of the imaging optics so that the first and second fiducial light projected onto the first and second detector regions maintain relatively constant positions within the first and second detector regions, respectively. Another embodiment of the present invention is a microscope that includes the imaging arrangement.

  4. Microscopic Theory of Transconductivity

    Directory of Open Access Journals (Sweden)

    A. P. Jauho

    1998-01-01

    Full Text Available Measurements of momentum transfer between two closely spaced mesoscopic electronic systems, which couple via Coulomb interaction but where tunneling is inhibited, have proven to be a fruitful method of extracting information about interactions in mesoscopic systems. We report a fully microscopic theory for transconductivity σ12, or, equivalently, momentum transfer rate between the system constituents. Our main formal result expresses the transconductivity in terms of two fluctuation diagrams, which are topologically related, but not equivalent to, the Azlamazov-Larkin and Maki-Thompson diagrams known for superconductivity. In the present paper the magnetic field dependence of σ12 is discussed, and we find that σ12(B is strongly enhanced over its zero field value, and it displays strong features, which can be understood in terms of a competition between density-of-states and screening effects.

  5. Ultracold atoms on atom chips

    DEFF Research Database (Denmark)

    Krüger, Peter; Hofferberth, S.; Haller, E.

    2005-01-01

    Miniaturized potentials near the surface of atom chips can be used as flexible and versatile tools for the manipulation of ultracold atoms on a microscale. The full scope of possibilities is only accessible if atom-surface distances can be reduced to microns. We discuss experiments in this regime...

  6. Scanning Probe Microscope-Based Fluid Dispensing

    Directory of Open Access Journals (Sweden)

    Murali Krishna Ghatkesar

    2014-10-01

    Full Text Available Advances in micro and nano fabrication technologies have enabled fabrication of smaller and more sensitive devices for applications not only in solid-state physics but also in medicine and biology. The demand for devices that can precisely transport material, specifically fluids are continuously increasing. Therefore, integration of various technologies with numerous functionalities in one single device is important. Scanning probe microscope (SPM is one such device that has evolved from atomic force microscope for imaging to a variety of microscopes by integrating different physical and chemical mechanisms. In this article, we review a particular class of SPM devices that are suited for fluid dispensing. We review their fabrication methods, fluid-pumping mechanisms, real-time monitoring of dispensing, physics of dispensing, and droplet characterization. Some of the examples where these probes have already been applied are also described. Finally, we conclude with an outlook and future scope for these devices where femtolitre or smaller volumes of liquid handling are needed.

  7. Proper alignment of the microscope.

    Science.gov (United States)

    Rottenfusser, Rudi

    2013-01-01

    The light microscope is merely the first element of an imaging system in a research facility. Such a system may include high-speed and/or high-resolution image acquisition capabilities, confocal technologies, and super-resolution methods of various types. Yet more than ever, the proverb "garbage in-garbage out" remains a fact. Image manipulations may be used to conceal a suboptimal microscope setup, but an artifact-free image can only be obtained when the microscope is optimally aligned, both mechanically and optically. Something else is often overlooked in the quest to get the best image out of the microscope: Proper sample preparation! The microscope optics can only do its job when its design criteria are matched to the specimen or vice versa. The specimen itself, the mounting medium, the cover slip, and the type of immersion medium (if applicable) are all part of the total optical makeup. To get the best results out of a microscope, understanding the functions of all of its variable components is important. Only then one knows how to optimize these components for the intended application. Different approaches might be chosen to discuss all of the microscope's components. We decided to follow the light path which starts with the light source and ends at the camera or the eyepieces. To add more transparency to this sequence, the section up to the microscope stage was called the "Illuminating Section", to be followed by the "Imaging Section" which starts with the microscope objective. After understanding the various components, we can start "working with the microscope." To get the best resolution and contrast from the microscope, the practice of "Koehler Illumination" should be understood and followed by every serious microscopist. Step-by-step instructions as well as illustrations of the beam path in an upright and inverted microscope are included in this chapter. A few practical considerations are listed in Section 3. Copyright © 2013 Elsevier Inc. All rights

  8. Transmission electron microscope CCD camera

    Science.gov (United States)

    Downing, Kenneth H.

    1999-01-01

    In order to improve the performance of a CCD camera on a high voltage electron microscope, an electron decelerator is inserted between the microscope column and the CCD. This arrangement optimizes the interaction of the electron beam with the scintillator of the CCD camera while retaining optimization of the microscope optics and of the interaction of the beam with the specimen. Changing the electron beam energy between the specimen and camera allows both to be optimized.

  9. Scanning Electron Microscope Analysis System

    Data.gov (United States)

    Federal Laboratory Consortium — This facility provides the capability to examine surfaces microscopically with high resolution (5 nanometers), perform micro chemical analyses of these surfaces, and...

  10. Energy Filtering and Coaxial Detection of the Backscattered Electrons in Scanning Electron Microscope

    Institute of Scientific and Technical Information of China (English)

    JIANG Chang-Zhong; P. Morin; N. Rosenberg

    2000-01-01

    A new detection system in scanning electron microscope, which filters in energy and detects the backscattered electrons close to the microscope axis, is described. This technique ameliorates the dependence of the back. scat tering coefficient on atomic number, and suppresses effectively the relief contrast at the same time. Therefore this new method is very suitable to the composition analysis.

  11. Method of γ(fcc)→ε(hcp) Martensitic Transformation Shear Angle Determination by Atomic Force Microscope%γ(fcc)→ε(hcp)马氏体相变切变角的原子力显微镜测定方法

    Institute of Scientific and Technical Information of China (English)

    石玮; 郭正洪; 戎咏华; 陈世朴; 徐祖耀

    2001-01-01

    建立了一种测量γ(fcc)→ε(hcp)马氏体相变切变角的方法.运用Thompson四面体和几何模型推导出马氏体变体的迹线方向,通过计算求得相变浮凸角与真实切变角的对应关系.应用原子力显微镜(AFM)测量了Fe-30%Mn-6%Si合金应力诱发马氏体相变的浮凸角.文中两个实例计算结果分别为17.85°和21.10°,与理论值19.47°相比误差小于2°,表明该方法具有精度较高、操作简单的特点.%A modified method for the determination of γ(fcc)→ε(hcp) martensitic transformation shear angle was established. Thompson tetrahedron and geometry analysis were used to calculate the directions of variant traces on specimen surface, then the relationship between the transformation shear angle and surface relief angle was deduced. The surface relief angles caused by stress-induced γ(fcc)→e(hcp) transformation for two surface regions in an Fe-30%Mn-6%Si alloy were measured by AFM (Atomic Force Microscope) and the corresponding shear angles were calculated to be 17.85° and 21.10° respectively. The deviation compared to the theoretical value (19.47°) is reasonably small, suggesting that the method is reliable and quite simple.

  12. Limits in detecting an individual dopant atom embedded in a crystal.

    Science.gov (United States)

    Mittal, Anudha; Mkhoyan, K Andre

    2011-07-01

    Annular dark field scanning transmission electron microscope (ADF-STEM) images allow detection of individual dopant atoms located on the surface of or inside a crystal. Contrast between intensities of an atomic column containing a dopant atom and a pure atomic column in ADF-STEM image depends strongly on specimen parameters and microscope conditions. Analysis of multislice-based simulations of ADF-STEM images of crystals doped with one substitutional dopant atom for a wide range of crystal thicknesses, types and locations of dopant atom inside the crystal, and crystals with different atoms reveal some interesting trends and non-intuitive behaviours in visibility of the dopant atom. The results provide practical guidelines to determine the optimal microscope and specimen conditions to detect a dopant atom in experiment, obtain information about the 3-d location of a dopant atom, and recognize cases where detecting a single dopant atom is not possible. Copyright © 2011 Elsevier B.V. All rights reserved.

  13. A quadruple-scanning-probe force microscope for electrical property measurements of microscopic materials.

    Science.gov (United States)

    Higuchi, Seiji; Kubo, Osamu; Kuramochi, Hiromi; Aono, Masakazu; Nakayama, Tomonobu

    2011-07-15

    Four-terminal electrical measurement is realized on a microscopic structure in air, without a lithographic process, using a home-built quadruple-scanning-probe force microscope (QSPFM). The QSPFM has four probes whose positions are individually controlled by obtaining images of a sample in the manner of atomic force microscopy (AFM), and uses the probes as contacting electrodes for electrical measurements. A specially arranged tuning fork probe (TFP) is used as a self-detection force sensor to operate each probe in a frequency modulation AFM mode, resulting in simultaneous imaging of the same microscopic feature on an insulator using the four TFPs. Four-terminal electrical measurement is then demonstrated in air by placing each probe electrode in contact with a graphene flake exfoliated on a silicon dioxide film, and the sheet resistance of the flake is measured by the van der Pauw method. The present work shows that the QSPFM has the potential to measure the intrinsic electrical properties of a wide range of microscopic materials in situ without electrode fabrication.

  14. A quadruple-scanning-probe force microscope for electrical property measurements of microscopic materials

    Energy Technology Data Exchange (ETDEWEB)

    Higuchi, Seiji; Kubo, Osamu; Kuramochi, Hiromi; Aono, Masakazu; Nakayama, Tomonobu, E-mail: higuchi.seiji@nims.go.jp, E-mail: nakayama.tomonobu@nims.go.jp [International Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science (NIMS), Tsukuba, Ibaraki 305-0044 (Japan)

    2011-07-15

    Four-terminal electrical measurement is realized on a microscopic structure in air, without a lithographic process, using a home-built quadruple-scanning-probe force microscope (QSPFM). The QSPFM has four probes whose positions are individually controlled by obtaining images of a sample in the manner of atomic force microscopy (AFM), and uses the probes as contacting electrodes for electrical measurements. A specially arranged tuning fork probe (TFP) is used as a self-detection force sensor to operate each probe in a frequency modulation AFM mode, resulting in simultaneous imaging of the same microscopic feature on an insulator using the four TFPs. Four-terminal electrical measurement is then demonstrated in air by placing each probe electrode in contact with a graphene flake exfoliated on a silicon dioxide film, and the sheet resistance of the flake is measured by the van der Pauw method. The present work shows that the QSPFM has the potential to measure the intrinsic electrical properties of a wide range of microscopic materials in situ without electrode fabrication.

  15. Athena microscopic Imager investigation

    Science.gov (United States)

    Herkenhoff, K. E.; Squyres, S. W.; Bell, J.F.; Maki, J.N.; Arneson, H.M.; Bertelsen, P.; Brown, D.I.; Collins, S.A.; Dingizian, A.; Elliott, S.T.; Goetz, W.; Hagerott, E.C.; Hayes, A.G.; Johnson, M.J.; Kirk, R.L.; McLennan, S.; Morris, R.V.; Scherr, L.M.; Schwochert, M.A.; Shiraishi, L.R.; Smith, G.H.; Soderblom, L.A.; Sohl-Dickstein, J. N.; Wadsworth, M.V.

    2003-01-01

    The Athena science payload on the Mars Exploration Rovers (MER) includes the Microscopic Imager (MI). The MI is a fixed-focus camera mounted on the end of an extendable instrument arm, the Instrument Deployment Device (IDD). The MI was designed to acquire images at a spatial resolution of 30 microns/pixel over a broad spectral range (400-700 nm). The MI uses the same electronics design as the other MER cameras but has optics that yield a field of view of 31 ?? 31 mm across a 1024 ?? 1024 pixel CCD image. The MI acquires images using only solar or skylight illumination of the target surface. A contact sensor is used to place the MI slightly closer to the target surface than its best focus distance (about 66 mm), allowing concave surfaces to be imaged in good focus. Coarse focusing (???2 mm precision) is achieved by moving the IDD away from a rock target after the contact sensor has been activated. The MI optics are protected from the Martian environment by a retractable dust cover. The dust cover includes a Kapton window that is tinted orange to restrict the spectral bandpass to 500-700 nm, allowing color information to be obtained by taking images with the dust cover open and closed. MI data will be used to place other MER instrument data in context and to aid in petrologic and geologic interpretations of rocks and soils on Mars. Copyright 2003 by the American Geophysical Union.

  16. Ludwig Boltzmann: Atomic genius

    Energy Technology Data Exchange (ETDEWEB)

    Cercignani, C. [Department of Mathematics, Politecnico di Milano (Italy)]. E-mail: carcer@mate.polimi.it

    2006-09-15

    On the centenary of the death of Ludwig Boltzmann, Carlo Cercignani examines the immense contributions of the man who pioneered our understanding of the atomic nature of matter. The man who first gave a convincing explanation of the irreversibility of the macroscopic world and the symmetry of the laws of physics was the Austrian physicist Ludwig Boltzmann, who tragically committed suicide 100 years ago this month. One of the key figures in the development of the atomic theory of matter, Boltzmann's fame will be forever linked to two fundamental contributions to science. The first was his interpretation of 'entropy' as a mathematically well-defined measure of the disorder of atoms. The second was his derivation of what is now known as the Boltzmann equation, which describes the statistical properties of a gas as made up of molecules. The equation, which described for the first time how a probability can evolve with time, allowed Boltzmann to explain why macroscopic phenomena are irreversible. The key point is that while microscopic objects like atoms can behave reversibly, we never see broken coffee cups reforming because it would involve a long series of highly improbable interactions - and not because it is forbidden by the laws of physics. (U.K.)

  17. Direct observation of a long-lived single-atom catalyst chiseling atomic structures in graphene.

    Science.gov (United States)

    Wang, Wei Li; Santos, Elton J G; Jiang, Bin; Cubuk, Ekin Dogus; Ophus, Colin; Centeno, Alba; Pesquera, Amaia; Zurutuza, Amaia; Ciston, Jim; Westervelt, Robert; Kaxiras, Efthimios

    2014-02-12

    Fabricating stable functional devices at the atomic scale is an ultimate goal of nanotechnology. In biological processes, such high-precision operations are accomplished by enzymes. A counterpart molecular catalyst that binds to a solid-state substrate would be highly desirable. Here, we report the direct observation of single Si adatoms catalyzing the dissociation of carbon atoms from graphene in an aberration-corrected high-resolution transmission electron microscope (HRTEM). The single Si atom provides a catalytic wedge for energetic electrons to chisel off the graphene lattice, atom by atom, while the Si atom itself is not consumed. The products of the chiseling process are atomic-scale features including graphene pores and clean edges. Our experimental observations and first-principles calculations demonstrated the dynamics, stability, and selectivity of such a single-atom chisel, which opens up the possibility of fabricating certain stable molecular devices by precise modification of materials at the atomic scale.

  18. Atomic physics

    CERN Document Server

    Born, Max

    1989-01-01

    The Nobel Laureate's brilliant exposition of the kinetic theory of gases, elementary particles, the nuclear atom, wave-corpuscles, atomic structure and spectral lines, electron spin and Pauli's principle, quantum statistics, molecular structure and nuclear physics. Over 40 appendices, a bibliography, numerous figures and graphs.

  19. Atomic Calligraphy

    Science.gov (United States)

    Imboden, Matthias; Pardo, Flavio; Bolle, Cristian; Han, Han; Tareen, Ammar; Chang, Jackson; Christopher, Jason; Corman, Benjamin; Bishop, David

    2013-03-01

    Here we present a MEMS based method to fabricate devices with a small number of atoms. In standard semiconductor fabrication, a large amount of material is deposited, after which etching removes what is not wanted. This technique breaks down for structures that approach the single atom limit, as it is inconceivable to etch away all but one atom. What is needed is a bottom up method with single or near single atom precision. We demonstrate a MEMS device that enables nanometer position controlled deposition of gold atoms. A digitally driven plate is swept as a flux of gold atoms passes through an aperture. Appling voltages on four comb capacitors connected to the central plate by tethers enable nanometer lateral precision in the xy plane over 15x15 sq. microns. Typical MEMS structures have manufacturing resolutions on the order of a micron. Using a FIB it is possible to mill apertures as small as 10 nm in diameter. Assuming a low incident atomic flux, as well as an integrated MEMS based shutter with microsecond response time, it becomes possible to deposit single atoms. Due to their small size and low power consumption, such nano-printers can be mounted directly in a cryogenic system at ultrahigh vacuum to deposit clean quench condensed metallic structures.

  20. Infrared up-conversion microscope

    DEFF Research Database (Denmark)

    2014-01-01

    There is presented an up-conversion infrared microscope (110) arranged for imaging an associated object (130), wherein the up-conversion infrared microscope (110) comprises a non-linear crystal (120) arranged for up-conversion of infrared electromagnetic radiation, and wherein an objective optical...

  1. The World Under a Microscope

    Institute of Scientific and Technical Information of China (English)

    2009-01-01

    Olympus sponsors the first national confocal microscopic-image competition The Olympus Cup National Confocal Microscopic-image Competition, the first of its kind in China,lifted its curtain in Beijing on November 1. Olympus (China) Co. Ltd. is the competition’s sole spon-

  2. Midfield microscope: exploring the extraordinary

    NARCIS (Netherlands)

    Docter, M.W.

    2008-01-01

    In this thesis the development of the midfield microscope is presented. This is a microscope in which the extraordinary transmission (EOT) through sub-wavelength hole-arrays is applied. Before trying to combine microscopy and EOT, we look at them separately. In chapter 1 an overview is given of the

  3. Modification Of Normal Microscope To Magneto-Optical Microscope

    Directory of Open Access Journals (Sweden)

    Nurazlin Ahmad

    2015-04-01

    Full Text Available Abstract The present work reports on the modification of polarizing microscope to a magnetic domain imaging microscope based on Faraday Effect. Sample used in this research is a ferromagnetic garnet BiTmNa3FeGa5O12. The halogen lamp in the microscope is replaced by helium-neon HeNe laser as a light source. To reduce the laser spatial coherent effect thin transparent plastics placed in the laser path. The plastics are rotated at certain velocity. Other factors to be considered are the plastic rotation velocity the laser intensity and the laser alignment. Typical magnetic domain pattern is obtained with the new system.

  4. Atomic Manipulation on Metal Surfaces

    Science.gov (United States)

    Ternes, Markus; Lutz, Christopher P.; Heinrich, Andreas J.

    Half a century ago, Nobel Laureate Richard Feynman asked in a now-famous lecture what would happen if we could precisely position individual atoms at will [R.P. Feynman, Eng. Sci. 23, 22 (1960)]. This dream became a reality some 30 years later when Eigler and Schweizer were the first to position individual Xe atoms at will with the probe tip of a low-temperature scanning tunneling microscope (STM) on a Ni surface [D.M. Eigler, E.K. Schweizer, Nature 344, 524 (1990)].

  5. Charge Qubit-Atom Hybrid

    CERN Document Server

    Yu, Deshui; Hufnagel, C; Kwek, L C; Amico, Luigi; Dumke, R

    2016-01-01

    We investigate a novel hybrid system of a superconducting charge qubit interacting directly with a single neutral atom via electric dipole coupling. Interfacing of the macroscopic superconducting circuit with the microscopic atomic system is accomplished by varying the gate capacitance of the charge qubit. To achieve strong interaction, we employ two Rydberg states with an electric-dipole-allowed transition, which alters the polarizability of the dielectric medium of the gate capacitor. Sweeping the gate voltage with different rates leads to a precise control of hybrid quantum states. Furthermore, we show a possible implementation of a universal two-qubit gate.

  6. Atomic Scale Computer Simulation for Early Precipitation Process of Ni75Al6Vi9 Alloy

    Institute of Scientific and Technical Information of China (English)

    Yuhong ZHAO; Hua HOU; Hong XU; Yongxin WANG; Zheng CHEN; Xiaodong SUN

    2003-01-01

    The atomic scale computer simulation for initial precipitation mechanism of Ni75Al6V19 alloy was carried out for the first time by employing the microscopic diffusion equation. The initial precipitation process was invest igated throughsimulating the atom

  7. 21 CFR 884.6190 - Assisted reproductive microscopes and microscope accessories.

    Science.gov (United States)

    2010-04-01

    ... 21 Food and Drugs 8 2010-04-01 2010-04-01 false Assisted reproductive microscopes and microscope... Devices § 884.6190 Assisted reproductive microscopes and microscope accessories. (a) Identification. Assisted reproduction microscopes and microscope accessories (excluding microscope stage warmers, which are...

  8. Microscopic Theory of Supercapacitors

    Science.gov (United States)

    Skinner, Brian Joseph

    As new energy technologies are designed and implemented, there is a rising demand for improved energy storage devices. At present the most promising class of these devices is the electric double-layer capacitor (EDLC), also known as the supercapacitor. A number of recently created supercapacitors have been shown to produce remarkably large capacitance, but the microscopic mechanisms that underlie their operation remain largely mysterious. In this thesis we present an analytical, microscopic-level theory of supercapacitors, and we explain how such large capacitance can result. Specifically, we focus on four types of devices that have been shown to produce large capacitance. The first is a capacitor composed of a clean, low-temperature two-dimensional electron gas adjacent to a metal gate electrode. Recent experiments have shown that such a device can produce capacitance as much as 40% larger than that of a conventional plane capacitor. We show that this enhanced capacitance can be understood as the result of positional correlations between electrons and screening by the gate electrode in the form of image charges. Thus, the enhancement of the capacitance can be understood primarily as a classical, electrostatic phenomenon. Accounting for the quantum mechanical properties of the electron gas provides corrections to the classical theory, and these are discussed. We also present a detailed numerical calculation of the capacitance of the system based on a calculation of the system's ground state energy using the variational principle. The variational technique that we develop is broadly applicable, and we use it here to make an accurate comparison to experiment and to discuss quantitatively the behavior of the electrons' correlation function. The second device discussed in this thesis is a simple EDLC composed of an ionic liquid between two metal electrodes. We adopt a simple description of the ionic liquid and show that for realistic parameter values the capacitance

  9. MICROSCOPIC USES OF NANOGOLD.

    Energy Technology Data Exchange (ETDEWEB)

    HAINFELD,J.F.POWELL,R.D.FURUYA,F.R.

    2003-04-17

    Gold has been used for immunocytochemistry since 1971 when Faulk and Taylor discovered adsorption of antibodies to colloidal gold. It is an ideal label for electron microscopy (EM) due to its high atomic number, which scatters electrons efficiently, and the fact that preparative methods have been developed to make uniform particles in the appropriate size range of 5 to 30 nm. Use in light microscopy (LM) generally requires silver enhancement (autometallography; AMG) of these small gold particles. Significant advances in this field since that time have included a better understanding of the conditions for best antibody adsorption, more regular gold size production, adsorption of other useful molecules, like protein A, and advances in silver enhancement. Many studies have also been accomplished showing the usefulness of these techniques to cell biology and biomedical research. A further advance in this field was the development of Nanogold{trademark}, a 1.4 nm gold cluster. A significant difference from colloidal gold is that Nanogold is actually a coordination compound containing a gold core covalently linked to surface organic groups. These in turn may be covalently attached to antibodies. This approach to immunolabeling has several advantages compared to colloidal gold such as vastly better penetration into tissues, generally greater sensitivity, and higher density of labeling. Since Nanogold is covalently coupled to antibodies, it may also be directly coupled to almost any protein, peptide, carbohydrate, or molecule of interest, including molecules which do not adsorb to colloidal gold. This increases the range of probes possible, and expands the applications of gold labeling.

  10. The head-mounted microscope.

    Science.gov (United States)

    Chen, Ting; Dailey, Seth H; Naze, Sawyer A; Jiang, Jack J

    2012-04-01

    Microsurgical equipment has greatly advanced since the inception of the microscope into the operating room. These advancements have allowed for superior surgical precision and better post-operative results. This study focuses on the use of the Leica HM500 head-mounted microscope for the operating phonosurgeon. The head-mounted microscope has an optical zoom from 2× to 9× and provides a working distance from 300 mm to 700 mm. The headpiece, with its articulated eyepieces, adjusts easily to head shape and circumference, and offers a focus function, which is either automatic or manually controlled. We performed five microlaryngoscopic operations utilizing the head-mounted microscope with successful results. By creating a more ergonomically favorable operating posture, a surgeon may be able to obtain greater precision and success in phonomicrosurgery. Phonomicrosurgery requires the precise manipulation of long-handled cantilevered instruments through the narrow bore of a laryngoscope. The head-mounted microscope shortens the working distance compared with a stand microscope, thereby increasing arm stability, which may improve surgical precision. Also, the head-mounted design permits flexibility in head position, enabling operator comfort, and delaying musculoskeletal fatigue. A head-mounted microscope decreases the working distance and provides better ergonomics in laryngoscopic microsurgery. These advances provide the potential to promote precision in phonomicrosurgery. Copyright © 2011 The American Laryngological, Rhinological, and Otological Society, Inc.

  11. Kinetic Atom.

    Science.gov (United States)

    Wilson, David B.

    1981-01-01

    Surveys the research of scientists like Joule, Kelvin, Maxwell, Clausius, and Boltzmann as it comments on the basic conceptual issues involved in the development of a more precise kinetic theory and the idea of a kinetic atom. (Author/SK)

  12. A fluorescence scanning electron microscope

    Directory of Open Access Journals (Sweden)

    Takaaki Kanemaru

    2010-01-01

    Full Text Available Fluorescence techniques are widely used in biological research to examine molecular localization, while electron microscopy can provide unique ultrastructural information. To date, correlative images from both fluorescence and electron microscopy have been obtained separately using two different instruments, i.e. a fluorescence microscope (FM and an electron microscope (EM. In the current study, a scanning electron microscope (SEM (JEOL JXA8600 M was combined with a fluorescence digital camera microscope unit and this hybrid instrument was named a fluorescence SEM (FL-SEM. In the labeling of FL-SEM samples, both Fluolid, which is an organic EL dye, and Alexa Fluor, were employed. We successfully demonstrated that the FL-SEM is a simple and practical tool for correlative fluorescence and electron microscopy.

  13. Microscopic examination of deteriorated concrete

    NARCIS (Netherlands)

    Nijland, T.G.; Larbi, J.A.

    2010-01-01

    Concrete petrography is the integrated microscopic and mesoscale (hand specimen size) investigation of hardened concrete, that can provide information on the composition of concrete, the original relationships between the concrete's various constituents, and any changes therein, whether as a result

  14. Microscopic Procedures for Plant Meiosis.

    Science.gov (United States)

    Braselton, James P.

    1997-01-01

    Describes laboratory techniques designed to familiarize students with meiosis and how microscopic preparations of meiosis are made. These techniques require the use of fresh or fixed flowers. Contains 18 references. (DDR)

  15. Microscopic Procedures for Plant Meiosis.

    Science.gov (United States)

    Braselton, James P.

    1997-01-01

    Describes laboratory techniques designed to familiarize students with meiosis and how microscopic preparations of meiosis are made. These techniques require the use of fresh or fixed flowers. Contains 18 references. (DDR)

  16. A design for a pinhole scanning helium microscope

    Energy Technology Data Exchange (ETDEWEB)

    Barr, M.; Fahy, A. [Centre for Organic Electronics, University of Newcastle, Callaghan, NSW 2308 (Australia); Jardine, A.; Ellis, J.; Ward, D. [Cavendish Laboratory, University of Cambridge, Madingley Road, Cambridge CB3 0HE (United Kingdom); MacLaren, D.A. [Dept. of Physics, University of Glasgow, Glasgow G12 8QQ (United Kingdom); Allison, W. [Cavendish Laboratory, University of Cambridge, Madingley Road, Cambridge CB3 0HE (United Kingdom); Dastoor, P.C., E-mail: Paul.Dastoor@newcastle.edu.au [Centre for Organic Electronics, University of Newcastle, Callaghan, NSW 2308 (Australia)

    2014-12-01

    We present a simplified design for a scanning helium microscope (SHeM) which utilises almost entirely off the shelf components. The SHeM produces images by detecting scattered neutral helium atoms from a surface, forming an entirely surface sensitive and non-destructive imaging technique. This particular prototype instrument avoids the complexities of existing neutral atom optics by replacing them with an aperture in the form of an ion beam milled pinhole, resulting in a resolution of around 5 microns. Using the images so far produced, an initial investigation of topological contrast has been performed.

  17. [MICROSCOPIC COLITIS: THE CLINICAL CASE].

    Science.gov (United States)

    Kulygina, Y A; Skalinskaya, M I; Ageeva, T A

    2015-01-01

    During past years incidence and prevalence of microscopic colitis (MC) have increased, that is possible caused to the improvement of knowledge of doctors about the disease. This article contain modern views on epidemiology, diagnostic and variant of microscopic colitis treatment. A typical clinical picture of MC in the form of recurrent a watery diarrhea, with the absence of pathologic changes at roentgenologic and endoscopic investigations is described with the example of a clinical case.

  18. On thermodynamic and microscopic reversibility

    Energy Technology Data Exchange (ETDEWEB)

    Crooks, Gavin E.

    2011-07-12

    The word 'reversible' has two (apparently) distinct applications in statistical thermodynamics. A thermodynamically reversible process indicates an experimental protocol for which the entropy change is zero, whereas the principle of microscopic reversibility asserts that the probability of any trajectory of a system through phase space equals that of the time reversed trajectory. However, these two terms are actually synonymous: a thermodynamically reversible process is microscopically reversible, and vice versa.

  19. Scanning tunneling microscope-laser fabrication of nanostructures

    Energy Technology Data Exchange (ETDEWEB)

    Yau, S.T.; Saltz, D.; Nayfeh, M.H. (Univ. of Illinois, Urbana (United States))

    The authors report on a technique to write nanometer-scale features on surfaces. The technique combines two of the most advanced technologies: the laser and the scanning tunneling microscope (STM). Laser radiation is used to break the chemical bonds of trimethylaluminum to free aluminum atoms in the region of the tunneling gap of the STM. The atoms are subsequently selectively excited and ionized. The ions are then driven softly toward the surface where they are deposited by the field in the tunneling gap of the microscope. Since the field of the tip can be confined to a few nanometers, the writing can be controlled with high resolution. The technique is also capable of filling holes and addressable nondestructive erasing.

  20. Nanometer-scale lithography on microscopically clean graphene

    DEFF Research Database (Denmark)

    van Dorp, W. F.; Zhang, X.; Feringa, B. L.

    2011-01-01

    to the deposition behavior on amorphous materials. Prior to the deposition experiment, the few-layer graphene was cleaned. Typically, it is observed in electron microscope images that areas of microscopically clean graphene are surrounded by areas with amorphous material. We present a method to remove the amorphous......Focused-electron-beam-induced deposition, or FEBID, enables the fabrication of patterns with sub-10 nm resolution. The initial stages of metal deposition by FEBID are still not fundamentally well understood. For these investigations, graphene, a one-atom-thick sheet of carbon atoms in a hexagonal...... lattice, is ideal as the substrate for FEBID writing. In this paper, we have used exfoliated few-layer graphene as a support to study the early growth phase of focused-electron-beam-induced deposition and to write patterns with dimensions between 0.6 and 5 nm. The results obtained here are compared...

  1. Ultra-precise holographic beam shaping for microscopic quantum control.

    Science.gov (United States)

    Zupancic, Philip; Preiss, Philipp M; Ma, Ruichao; Lukin, Alexander; Eric Tai, M; Rispoli, Matthew; Islam, Rajibul; Greiner, Markus

    2016-06-27

    High-resolution addressing of individual ultracold atoms, trapped ions or solid state emitters allows for exquisite control in quantum optics experiments. This becomes possible through large aperture magnifying optics that project microscopic light patterns with diffraction limited performance. We use programmable amplitude holograms generated on a digital micromirror device to create arbitrary microscopic beam shapes with full phase and amplitude control. The system self-corrects for aberrations of up to several λ and reduces them to λ/50, leading to light patterns with a precision on the 10-4 level. We demonstrate aberration-compensated beam shaping in an optical lattice experiment and perform single-site addressing in a quantum gas microscope for 87Rb.

  2. Ultra-precise holographic beam shaping for microscopic quantum control

    CERN Document Server

    Zupancic, Philip; Ma, Ruichao; Lukin, Alexander; Tai, M Eric; Rispoli, Matthew; Islam, Rajibul; Greiner, Markus

    2016-01-01

    High-resolution addressing of single ultracold atoms, trapped ions or solid state emitters allows for exquisite control in quantum optics experiments. This becomes possible through large aperture magnifying optics that project microscopic light patterns with diffraction limited performance. We use programmable amplitude holograms generated on a digital micromirror device to create arbitrary microscopic beam shapes with full phase and amplitude control. The system self-corrects for aberrations of up to several $\\lambda$ and reduces them to $\\lambda/50$, leading to light patterns with a precision on the $10^{-4}$ level. We demonstrate aberration-compensated beam shaping in an optical lattice experiment and perform single-site addressing in a quantum gas microscope for $^{87}$Rb.

  3. Scanning Miniature Microscopes without Lenses

    Science.gov (United States)

    Wang, Yu

    2009-01-01

    The figure schematically depicts some alternative designs of proposed compact, lightweight optoelectronic microscopes that would contain no lenses and would generate magnified video images of specimens. Microscopes of this type were described previously in Miniature Microscope Without Lenses (NPO - 20218), NASA Tech Briefs, Vol. 22, No. 8 (August 1998), page 43 and Reflective Variants of Miniature Microscope Without Lenses (NPO 20610), NASA Tech Briefs, Vol. 26, No. 9 (September 1999), page 6a. To recapitulate: In the design and construction of a microscope of this type, the focusing optics of a conventional microscope are replaced by a combination of a microchannel filter and a charge-coupled-device (CCD) image detector. Elimination of focusing optics reduces the size and weight of the instrument and eliminates the need for the time-consuming focusing operation. The microscopes described in the cited prior articles contained two-dimensional CCDs registered with two-dimensional arrays of microchannels and, as such, were designed to produce full two-dimensional images, without need for scanning. The microscopes of the present proposal would contain one-dimensional (line image) CCDs registered with linear arrays of microchannels. In the operation of such a microscope, one would scan a specimen along a line perpendicular to the array axis (in other words, one would scan in pushbroom fashion). One could then synthesize a full two-dimensional image of the specimen from the line-image data acquired at one-pixel increments of position along the scan. In one of the proposed microscopes, a beam of unpolarized light for illuminating the specimen would enter from the side. This light would be reflected down onto the specimen by a nonpolarizing beam splitter attached to the microchannels at their lower ends. A portion of the light incident on the specimen would be reflected upward, through the beam splitter and along the microchannels, to form an image on the CCD. If the

  4. Atomic resolution images of solid-liquid interfaces

    OpenAIRE

    Giambattista, Brian; McNairy, W. W.; Slough, C. G.; Johnson, A.; Bell, L. D.; Coleman, R. V.; Schneir, J.; Sonnenfeld, R.; Drake, B; Hansma, P K

    1987-01-01

    A scanning tunneling microscope (STM) can provide atomic-resolution images of solids covered with a variety of liquids, including cryogenic fluids, both polar and nonpolar solvents, conductive aqueous solutions, oils, and even greases. This short overview includes images of solids covered with liquid nitrogen, liquid helium, paraffin oil, silicone oil, microscope immersion oil, silicone vacuum grease, fluorocarbon grease, glycerol, and salt water. These images show atoms, charge-density waves...

  5. Progress & perspectives for atomic-resolution electron microscopy

    OpenAIRE

    Smith, David J.

    2010-01-01

    The transmission electron microscope (TEM) has evolved into a highly sophisticated instrument that is ideally suited to the characterization of advanced materials. Atomic-level information is routinely accessible using both fixed-beam and scanning TEMs. This report briefly considers developments in the field of atomic-resolution electron microscopy. Recent activities include renewed attention to on-line microscope control (‘autotuning’), and assessment and correction of aberrations. Aberratio...

  6. Eliminating light shifts for single atom trapping

    Science.gov (United States)

    Hutzler, Nicholas R.; Liu, Lee R.; Yu, Yichao; Ni, Kang-Kuen

    2017-02-01

    Microscopically controlled neutral atoms in optical tweezers and lattices have led to exciting advances in the study of quantum information and quantum many-body systems. The light shifts of atomic levels from the trapping potential in these systems can result in detrimental effects such as fluctuating dipole force heating, inhomogeneous detunings, and inhibition of laser cooling, which limits the atomic species that can be manipulated. In particular, these light shifts can be large enough to prevent loading into optical tweezers directly from a magneto-optical trap. We implement a general solution to these limitations by loading, as well as cooling and imaging the atoms with temporally alternating beams, and present an analysis of the role of heating and required cooling for single atom tweezer loading. Because this technique does not depend on any specific spectral properties, it should enable the optical tweezer platform to be extended to nearly any atomic or molecular species that can be laser cooled and optically trapped.

  7. Isolating and moving single atoms using silicon nanocrystals

    Science.gov (United States)

    Carroll, Malcolm S.

    2010-09-07

    A method is disclosed for isolating single atoms of an atomic species of interest by locating the atoms within silicon nanocrystals. This can be done by implanting, on the average, a single atom of the atomic species of interest into each nanocrystal, and then measuring an electrical charge distribution on the nanocrystals with scanning capacitance microscopy (SCM) or electrostatic force microscopy (EFM) to identify and select those nanocrystals having exactly one atom of the atomic species of interest therein. The nanocrystals with the single atom of the atomic species of interest therein can be sorted and moved using an atomic force microscope (AFM) tip. The method is useful for forming nanoscale electronic and optical devices including quantum computers and single-photon light sources.

  8. Atomic theories

    CERN Document Server

    Loring, FH

    2014-01-01

    Summarising the most novel facts and theories which were coming into prominence at the time, particularly those which had not yet been incorporated into standard textbooks, this important work was first published in 1921. The subjects treated cover a wide range of research that was being conducted into the atom, and include Quantum Theory, the Bohr Theory, the Sommerfield extension of Bohr's work, the Octet Theory and Isotopes, as well as Ionisation Potentials and Solar Phenomena. Because much of the material of Atomic Theories lies on the boundary between experimentally verified fact and spec

  9. Microscope and method of use

    Science.gov (United States)

    Bongianni, Wayne L.

    1984-01-01

    A method and apparatus for electronically focusing and electronically scanning microscopic specimens are given. In the invention, visual images of even moving, living, opaque specimens can be acoustically obtained and viewed with virtually no time needed for processing (i.e., real time processing is used). And planar samples are not required. The specimens (if planar) need not be moved during scanning, although it will be desirable and possible to move or rotate nonplanar specimens (e.g., laser fusion targets) against the lens of the apparatus. No coupling fluid is needed, so specimens need not be wetted. A phase acoustic microscope is also made from the basic microscope components together with electronic mixers.

  10. Mosaic of Commemorative Microscope Substrate

    Science.gov (United States)

    2008-01-01

    Written by electron beam lithography in the Microdevices Laboratory of NASA's Jet Propulsion Laboratory, this Optical Microscope substrate helps the Phoenix Mars Mission science team learn how to assemble individual microscope images into a mosaic by aligning rows of text. Each line is about 0.1 millimeter tall, the average thickness of a human hair. Except for the Mogensen twins, the names are of babies born and team members lost during the original development of MECA (the Microscopy, Electrochemistry and Conductivity Analyzer) for the canceled 2001 Mars lander mission. The plaque also acknowledges the MECA 2001 principal investigator, now retired. This image was taken by the MECA Optical Microscope on Sol 111, or the 111th day of the Phoenix mission (Sept. 16, 2008). The Phoenix Mission is led by the University of Arizona, Tucson, on behalf of NASA. Project management of the mission is by JPL, Pasadena, Calif. Spacecraft development was by Lockheed Martin Space Systems, Denver.

  11. Ergonomic microscope comfort and control.

    Science.gov (United States)

    Thomas, Elizabeth Anne

    2011-03-01

    Microscope use in the inspection phase of computer chip manufacturing is a major cause of worker discomfort and injury. A two-phase ergonomics project to reduce employee fatigue and discomfort was planned, implemented, and evaluated in a microscope user environment within a high-technology manufacturing environment. Total Quality Management methodology and tools were employed by a multidisciplinary team led by an occupational health nurse practitioner to accomplish the project goals. A multifaceted approach including equipment changes, administrative changes, and focused training for behavior changes achieved the desired reduction in reports of fatigue and discomfort among microscope users. Occupational health nurses are ideal candidates to lead teams to accomplish meaningful health and safety goals consistent with corporate quality initiatives and strategic objectives. Copyright 2011, SLACK Incorporated.

  12. Macroscopic-microscopic mass models

    CERN Document Server

    Nix, J R; Nix, J Rayford; Moller, Peter

    1995-01-01

    We discuss recent developments in macroscopic-microscopic mass models, including the 1992 finite-range droplet model, the 1992 extended-Thomas-Fermi Strutinsky-integral model, and the 1994 Thomas-Fermi model, with particular emphasis on how well they extrapolate to new regions of nuclei. We also address what recent developments in macroscopic-microscopic mass models are teaching us about such physically relevant issues as the nuclear curvature energy, a new congruence energy arising from a greater-than-average overlap of neutron and proton wave functions, the nuclear incompressibility coefficient, and the Coulomb redistribution energy arising from a central density depression. We conclude with a brief discussion of the recently discovered rock of metastable superheavy nuclei near 272:110 that had been correctly predicted by macroscopic-microscopic models, along with a possible new tack for reaching an island near 290:110 beyond our present horizon.

  13. Sample holder support for microscopes

    Science.gov (United States)

    Berry, Anthony (Inventor); Nerren, Billy H. (Inventor)

    1991-01-01

    A sample filter holder is disclosed for use with a microscope for holding the filter in a planar condition on the stage of the microscope so that automatic focusing of the microscope can be performed on particle samples dispersed on the filter. The holder includes a base having a well that communicates with an inlet port which is connected to a suction pump. A screen assembly is positioned within the well. The screen assembly includes a disk having a screen positioned on its top surface and secured to the disk at the peripheral edge of the screen. Small bores allow the outer surface of the screen to communicate with the well. The filter is placed on the screen and is held in a flat disposition by the suction forces.

  14. Construction of a New Atom-Probe and its Application to Study of Solute Behavior in Dilute Iron Base Alloys.

    Science.gov (United States)

    Al-Saleh, Kamal Amein

    An ultra-high-vacuum (UHC) time-of-flight atom -probe field ion microscope (ToF atom-probe) has been designed, constructed and operated successfully. The new ToF atom -probe is equipped with the following: (1) A poschenrieder electrostatic focusing lens for high mass resolution and noise-free performance, (2) a second chevron-channel plate -phosphor screen assembly in front of the Poschenrieder lens to be used for precise determination of the probing area and detection efficiency, (3) a quick-sample change chamber with a vacuum lock which is also used as a reaction chamber, (4) a closed-cycle liquid He refrigeration unit to cool a specimen tip down to 25 K for a better quality image, and (5) an automated data acquisition system which consists of an 8-channel digital timer with a 200 MHz internal clock and a DEC MINCII minicomputer which is capable of performing data collection at a pulse repetition rate up to 100/sec, with a mass resolution m/(DELTA)m of (TURN)1200. Using this instrument, the following alloys have been investigated: (1) Fe-0.29; 0.64; and 1.46 wt % Ti alloys. It was found that Ti segregates to the surface upon annealing the tip in vacuum at and above 650(DEGREES)C and its concentration is approximately 90% at the first layer, 20% at the second layer, 10% at the third layer and the bulk value thereafter. CO and H(,2) alone appear to have no effect at all on the segregation of Ti. However, oxygen has had profound effect on the behavior of Ti, demonstrating the initial stages of both oxidation (TiO scale formation) and internal oxidation (TiO, FeO clusters in Fe matrix) for the first time on an atomic scale. (2) Fe-0.17 wt % P alloy: P segregation to the interface was studied at the temperatures of 300 to 600(DEGREES)C. In one of the samples a carbide precipitate was found with an approximate composition of M(,5)C, where phosphorus was rejected by the M(,5)C precipitate and upon annealing the tip in vacuum P segregated at the interface.

  15. Microscopic Materials on a Magnet

    Science.gov (United States)

    2008-01-01

    These images show a comparison of the weak magnet OM7 from the Optical Microscope on NASA's Phoenix Mars Lander before (left) and after (right) soil deposition. The microscope took the left image during Phoenix's Sol 15 (June 10, 2008) and the right image during Sol 21 (Jun 16, 2008). The Phoenix Mission is led by the University of Arizona, Tucson, on behalf of NASA. Project management of the mission is by NASA's Jet Propulsion Laboratory, Pasadena, Calif. Spacecraft development is by Lockheed Martin Space Systems, Denver.

  16. Connection of Magnetic Antisense Probe with SK-Br-3 Oncocyte mRNA Nucleotide Detected by High Resolution Atomic Force Microscope%高精度原子力显微镜显示磁性反义探针与SK-Br-3肿瘤细胞mRNA核苷酸连接

    Institute of Scientific and Technical Information of China (English)

    谭书德; 欧阳羽; 李信友; 文明; 李少林

    2011-01-01

    为了将高精度原子力显微镜(AFM)用于显示超顺磁性氧化铁标记的c-erbB2癌基因反义寡脱氧核苷酸探针(磁性反义探针)与SK-Br-3肿瘤细胞mRNA核苷酸的连接,我们在磁性反义探针转染SK-Br-3肿瘤细胞基础上,用AFM对转染后的肿瘤细胞进行观察,并同时对转染后的肿瘤细胞进行蛋白表达检测及MRI成像,以进一步证实AFM的观察结果.从AFM显示的磁性反义探针转染SK-Br-3肿瘤细胞后单个细胞的全貌图及局部放大图发现,探针中反义寡脱氧核苷酸中的脱氧胞嘧啶核苷酸闭环与肿瘤细胞mRNA嘌呤核苷酸环相连接;此外,磁性反义探针能特异性抑制SK-Br3细胞c-erbB2的蛋白表达,MRI显示磁性反义探针转染SK-Br-3肿瘤细胞的信号强度最低(P<0.05).实验表明,AFM可以清楚显示磁性反义探针与SK-Br-3肿瘤细胞核mRNA核苷酸的连接.%The present paper is aimed to detect superparamagnetic iron oxide labeled c-erbB2 oncogene antisense oli-gonucleotide probe (magnetic antisense probe) connected with SK-Br-3 oncocyte mRNA nucleotide by high resolution atomic force microscope (AFM). We transfected SK-Br-3 oncocyte with magnetic antisense probe, then observed the cells by AFM with high resolution and detected protein expression and magnetic resonance imagine ( MRI). The high resolution AFM clearly showed the connection of the oligonucleotide remote end of magnetic antisense probe with the mRNA nucleotide of oncocyte. The expression of c-erbB2 protein in SK-Br3 cells were highly inhibited by using magnetic antisense probe. We then obtained the lowest signal to noise ratio (SNR) of SK-Br-3 oncocyte transfected with magnetic antisense probe by MRI (P<0. 05). These experiments demonstrated that the high resolution AFM could be used to show the binding of magnetic antisense probe and SK-Br-3 mRNA of tumor cell nuclear.

  17. Simulations of optical microscope images

    Science.gov (United States)

    Germer, Thomas A.; Marx, Egon

    2006-03-01

    The resolution of an optical microscope is limited by the optical wavelengths used. However, there is no fundamental limit to the sensitivity of a microscope to small differences in any of a feature's dimensions. That is, those limits are determined by such things as the sensitivity of the detector array, the quality of the optical system, and the stability of the light source. The potential for using this nearly unbounded sensitivity has sparked interest in extending optical microscopy to the characterization of sub-wavelength structures created by photolithography and using that characterization for process control. In this paper, an analysis of the imaging of a semiconductor grating structure with an optical microscope will be presented. The analysis includes the effects of partial coherence in the illumination system, aberrations of both the illumination and the collection optics, non-uniformities in the illumination, and polarization. It can thus model just about any illumination configuration imaginable, including Koehler illumination, focused (confocal) illumination, or dark-field illumination. By propagating Jones matrices throughout the system, polarization control at the back focal planes of both illumination and collection can be investigated. Given a detailed characterization of the microscope (including aberrations), images can be calculated and compared to real data, allowing details of the grating structure to be determined, in a manner similar to that found in scatterometry.

  18. Microscopic cross sections: An utopia?

    Energy Technology Data Exchange (ETDEWEB)

    Hilaire, S. [CEA Bruyeres-le-Chatel, DIF 91 (France); Koning, A.J. [Nuclear Research and Consultancy Group, PO Box 25, 1755 ZG Petten (Netherlands); Goriely, S. [Institut d' Astronomie et d' Astrophysique, Universite Libre de Bruxelles, Campus de la Plaine, CP 226, 1050 Brussels (Belgium)

    2010-07-01

    The increasing need for cross sections far from the valley of stability poses a challenge for nuclear reaction models. So far, predictions of cross sections have relied on more or less phenomenological approaches, depending on parameters adjusted to available experimental data or deduced from systematical relations. While such predictions are expected to be reliable for nuclei not too far from the experimentally known regions, it is clearly preferable to use more fundamental approaches, based on sound physical bases, when dealing with very exotic nuclei. Thanks to the high computer power available today, all major ingredients required to model a nuclear reaction can now be (and have been) microscopically (or semi-microscopically) determined starting from the information provided by a nucleon-nucleon effective interaction. We have implemented all these microscopic ingredients in the TALYS nuclear reaction code, and we are now almost able to perform fully microscopic cross section calculations. The quality of these ingredients and the impact of using them instead of the usually adopted phenomenological parameters will be discussed. (authors)

  19. Microscope sterility during spine surgery.

    Science.gov (United States)

    Bible, Jesse E; O'Neill, Kevin R; Crosby, Colin G; Schoenecker, Jonathan G; McGirt, Matthew J; Devin, Clinton J

    2012-04-01

    Prospective study. Assess the contamination rates of sterile microscope drapes after spine surgery. The use of the operating microscope has become more prevalent in certain spine procedures, providing superior magnification, visualization, and illumination of the operative field. However, it may represent an additional source of bacterial contamination and increase the risk of developing a postoperative infection. This study included 25 surgical spine cases performed by a single spine surgeon that required the use of the operative microscope. Sterile culture swabs were used to obtain samples from 7 defined locations on the microscope drape after its use during the operation. The undraped technician's console was sampled in each case as a positive control, and an additional 25 microscope drapes were swabbed immediately after they were applied to the microscope to obtain negative controls. Swab samples were assessed for bacterial growth on 5% sheep blood Columbia agar plates using a semiquantitative technique. No growth was observed on any of the 25 negative control drapes. In contrast, 100% of preoperative and 96% of postoperative positive controls demonstrated obvious contamination. In the postoperative group, all 7 sites of evaluation were found to be contaminated with rates of 12% to 44%. Four of the 7 evaluated locations were found to have significant contamination rates compared with negative controls, including the shafts of the optic eyepieces on the main surgeon side (24%, P = 0.022), "forehead" portion on both the main surgeon (24%, P = 0.022) and assistant sides (28%, P = 0.010), and "overhead" portion of the drape (44%, P = 0.0002). Bacterial contamination of the operative microscope was found to be significant after spine surgery. Contamination was more common around the optic eyepieces, likely due to inadvertent touching of unsterile portions. Similarly, all regions above the eyepieces also have a propensity for contamination because of unknown contact

  20. Atomic rivals

    Energy Technology Data Exchange (ETDEWEB)

    Goldschmidt, B.

    1990-01-01

    This book is a memoir of rivalries among the Allies over the bomb, by a participant and observer. Nuclear proliferation began in the uneasy wartime collaboration of the United States, England, Canada, and Free France to produce the atom bomb. Through the changes of history, a young French chemist had a role in almost every act of this international drama. This memoir is based on Goldschmidt's own recollections, interviews with other leading figures, and 3,000 pages of newly declassified documents in Allied archives. From his own start as Marie Curie's lab assistant, Goldschmidt's career was closely intertwined with Frances complicated rise to membership in the nuclear club. As a refugee from the Nazis, he became part of the wartime nuclear energy project in Canada and found himself the only French scientist to work (although briefly) on the American atom bomb project.

  1. Atom-by-Atom Construction of a Quantum Device.

    Science.gov (United States)

    Petta, Jason R

    2017-03-28

    Scanning tunneling microscopes (STMs) are conventionally used to probe surfaces with atomic resolution. Recent advances in STM include tunneling from spin-polarized and superconducting tips, time-domain spectroscopy, and the fabrication of atomically precise Si nanoelectronics. In this issue of ACS Nano, Tettamanzi et al. probe a single-atom transistor in silicon, fabricated using the precision of a STM, at microwave frequencies. While previous studies have probed such devices in the MHz regime, Tettamanzi et al. probe a STM-fabricated device at GHz frequencies, which enables excited-state spectroscopy and measurements of the excited-state lifetime. The success of this experiment will enable future work on quantum control, where the wave function must be controlled on a time scale that is much shorter than the decoherence time. We review two major approaches that are being pursued to develop spin-based quantum computers and highlight some recent progress in the atom-by-atom fabrication of donor-based devices in silicon. Recent advances in STM lithography may enable practical bottom-up construction of large-scale quantum devices.

  2. Immunogold labels: cell-surface markers in atomic force microscopy

    NARCIS (Netherlands)

    Putman, Constant A.J.; Grooth, de Bart G.; Hansma, Paul K.; Hulst, van Niek F.; Greve, Jan

    1993-01-01

    The feasibility of using immunogold labels as cell-surface markers in atomic force microscopy is shown in this paper. The atomic force microscope (AFM) was used to image the surface of immunogold-labeled human lymphocytes. The lymphocytes were isolated from whole blood and labeled by an indirect imm

  3. Atomic physics

    Energy Technology Data Exchange (ETDEWEB)

    Livingston, A.E.; Kukla, K.; Cheng, S. [Univ. of Toledo, OH (United States)] [and others

    1995-08-01

    In a collaboration with the Atomic Physics group at Argonne and the University of Toledo, the Atomic Physics group at the University of Notre Dame is measuring the fine structure transition energies in highly-charged lithium-like and helium-like ions using beam-foil spectroscopy. Precise measurements of 2s-2p transition energies in simple (few-electron) atomic systems provide stringent tests of several classes of current atomic- structure calculations. Analyses of measurements in helium-like Ar{sup 16+} have been completed, and the results submitted for publication. A current goal is to measure the 1s2s{sup 3}S{sub 1} - 1s2p{sup 3}P{sub 0} transition wavelength in helium-like Ni{sup 26+}. Measurements of the 1s2s{sup 2}S{sub 1/2} - 1s2p{sup 2}P{sub 1/2,3/2} transition wavelengths in lithium-like Kr{sup 33+} is planned. Wavelength and lifetime measurements in copper-like U{sup 63+} are also expected to be initiated. The group is also participating in measurements of forbidden transitions in helium-like ions. A measurement of the lifetime of the 1s2s{sup 3}S{sub 1} state in Kr{sup 34+} was published recently. In a collaboration including P. Mokler of GSI, Darmstadt, measurements have been made of the spectral distribution of the 2E1 decay continuum in helium-like Kr{sup 34+}. Initial results have been reported and further measurements are planned.

  4. Making Mn substitutional impurities in InAs using a scanning tunneling microscope.

    Science.gov (United States)

    Song, Young Jae; Erwin, Steven C; Rutter, Gregory M; First, Phillip N; Zhitenev, Nikolai B; Stroscio, Joseph A

    2009-12-01

    We describe in detail an atom-by-atom exchange manipulation technique using a scanning tunneling microscope probe. As-deposited Mn adatoms (Mn(ad)) are exchanged one-by-one with surface In atoms (In(su)) to create a Mn surface-substitutional (Mn(In)) and an exchanged In adatom (In(ad)) by an electron tunneling induced reaction Mn(ad) + In(su) --> Mn(In) + In(ad) on the InAs(110) surface. In combination with density-functional theory and high resolution scanning tunneling microscopy imaging, we have identified the reaction pathway for the Mn and In atom exchange.

  5. Scanning force microscope for in situ nanofocused X-ray diffraction studies

    Energy Technology Data Exchange (ETDEWEB)

    Ren, Zhe, E-mail: zhe.ren@im2np.fr; Mastropietro, Francesca; Davydok, Anton [Aix-Marseille Université, CNRS, Faculté des Sciences, Campus de Saint-Jérôme, Avenue Escadrille Normandie Niemen – Case 142, F-13397 Marseille (France); Langlais, Simon [Grenoble Institute of Technology and CNRS, BP 75, F-38402 Saint-Martin d’Hères Cedex (France); Richard, Marie-Ingrid [Aix-Marseille Université, CNRS, Faculté des Sciences, Campus de Saint-Jérôme, Avenue Escadrille Normandie Niemen – Case 142, F-13397 Marseille (France); European Synchrotron Radiation Facility (ESRF), 6 rue Jules Horowitz, BP 220, 38043 Grenoble (France); Furter, Jean-Jacques; Thomas, Olivier [Aix-Marseille Université, CNRS, Faculté des Sciences, Campus de Saint-Jérôme, Avenue Escadrille Normandie Niemen – Case 142, F-13397 Marseille (France); Dupraz, Maxime; Verdier, Marc; Beutier, Guillaume [Grenoble Institute of Technology and CNRS, BP 75, F-38402 Saint-Martin d’Hères Cedex (France); Boesecke, Peter [European Synchrotron Radiation Facility (ESRF), 6 rue Jules Horowitz, BP 220, 38043 Grenoble (France); Cornelius, Thomas W. [Aix-Marseille Université, CNRS, Faculté des Sciences, Campus de Saint-Jérôme, Avenue Escadrille Normandie Niemen – Case 142, F-13397 Marseille (France)

    2014-08-06

    An atomic force microscope has been developed for combination with sub-micrometer focused X-ray diffraction at synchrotron beamlines and in situ mechanical tests on single nanostructures. A compact scanning force microscope has been developed for in situ combination with nanofocused X-ray diffraction techniques at third-generation synchrotron beamlines. Its capabilities are demonstrated on Au nano-islands grown on a sapphire substrate. The new in situ device allows for in situ imaging the sample topography and the crystallinity by recording simultaneously an atomic force microscope (AFM) image and a scanning X-ray diffraction map of the same area. Moreover, a selected Au island can be mechanically deformed using the AFM tip while monitoring the deformation of the atomic lattice by nanofocused X-ray diffraction. This in situ approach gives access to the mechanical behavior of nanomaterials.

  6. Reading and writing single-atom magnets

    Science.gov (United States)

    Natterer, Fabian D.; Yang, Kai; Paul, William; Willke, Philip; Choi, Taeyoung; Greber, Thomas; Heinrich, Andreas J.; Lutz, Christopher P.

    2017-03-01

    The single-atom bit represents the ultimate limit of the classical approach to high-density magnetic storage media. So far, the smallest individually addressable bistable magnetic bits have consisted of 3–12 atoms. Long magnetic relaxation times have been demonstrated for single lanthanide atoms in molecular magnets, for lanthanides diluted in bulk crystals, and recently for ensembles of holmium (Ho) atoms supported on magnesium oxide (MgO). These experiments suggest a path towards data storage at the atomic limit, but the way in which individual magnetic centres are accessed remains unclear. Here we demonstrate the reading and writing of the magnetism of individual Ho atoms on MgO, and show that they independently retain their magnetic information over many hours. We read the Ho states using tunnel magnetoresistance and write the states with current pulses using a scanning tunnelling microscope. The magnetic origin of the long-lived states is confirmed by single-atom electron spin resonance on a nearby iron sensor atom, which also shows that Ho has a large out-of-plane moment of 10.1 ± 0.1 Bohr magnetons on this surface. To demonstrate independent reading and writing, we built an atomic-scale structure with two Ho bits, to which we write the four possible states and which we read out both magnetoresistively and remotely by electron spin resonance. The high magnetic stability combined with electrical reading and writing shows that single-atom magnetic memory is indeed possible.

  7. Reading and writing single-atom magnets.

    Science.gov (United States)

    Natterer, Fabian D; Yang, Kai; Paul, William; Willke, Philip; Choi, Taeyoung; Greber, Thomas; Heinrich, Andreas J; Lutz, Christopher P

    2017-03-08

    The single-atom bit represents the ultimate limit of the classical approach to high-density magnetic storage media. So far, the smallest individually addressable bistable magnetic bits have consisted of 3-12 atoms. Long magnetic relaxation times have been demonstrated for single lanthanide atoms in molecular magnets, for lanthanides diluted in bulk crystals, and recently for ensembles of holmium (Ho) atoms supported on magnesium oxide (MgO). These experiments suggest a path towards data storage at the atomic limit, but the way in which individual magnetic centres are accessed remains unclear. Here we demonstrate the reading and writing of the magnetism of individual Ho atoms on MgO, and show that they independently retain their magnetic information over many hours. We read the Ho states using tunnel magnetoresistance and write the states with current pulses using a scanning tunnelling microscope. The magnetic origin of the long-lived states is confirmed by single-atom electron spin resonance on a nearby iron sensor atom, which also shows that Ho has a large out-of-plane moment of 10.1 ± 0.1 Bohr magnetons on this surface. To demonstrate independent reading and writing, we built an atomic-scale structure with two Ho bits, to which we write the four possible states and which we read out both magnetoresistively and remotely by electron spin resonance. The high magnetic stability combined with electrical reading and writing shows that single-atom magnetic memory is indeed possible.

  8. Demonstration of Parallel Scanning Probe Microscope for high throughput metrology and inspection

    OpenAIRE

    Sadeghian Marnani, H.; Dekker, A.; Herfst, R.W.; Winters, J.; Eigenraam, A.B.C.; Rijnbeek, R.A.; Nulkes, N.

    2015-01-01

    With the device dimensions moving towards the 1X node and below, the semiconductor industry is rapidly approaching the point where existing metrology, inspection and review tools face huge challenges in terms of resolution, the ability to resolve 3D and the throughput. Due to the advantages of sub-nanometer resolution and the ability of true 3D scanning, scanning probe microscope (SPM) and specifically atomic force microscope (AFM) are considered as alternative technologies for CD-metrology, ...

  9. Atomic diffusion properties in wire bonding

    Institute of Scientific and Technical Information of China (English)

    LI Jun-hui; WANG Fu-liang; HAN Lei; DUAN Ji-an; ZHONG Jue

    2006-01-01

    The lift-off characteristics at the interface of thermosonic bond were observed by using scanning electron microscope (JSM-6360LV). The vertical section of bonding point was produced by punching, grinding and ion-sputter thinning, and was tested by using transmission electron microscope (F30). The results show that the atomic diffusion at the bonded interface appears. The thickness of Au/Al interface characterized by atomic diffusion is about 500 nm under ultrasonic and thermal energy. The fracture morphology of lift-off interface is dimples. The tensile fracture appears by pull-test not in bonded interface but in basis material, and the bonded strength at interface is enhanced by diffused atom from the other side.

  10. The Atomic orbitals of the topological atom

    OpenAIRE

    Ramos-Cordoba, Eloy; Salvador Sedano, Pedro

    2013-01-01

    The effective atomic orbitals have been realized in the framework of Bader's atoms in molecules theory for a general wavefunction. This formalism can be used to retrieve from any type of calculation a proper set of orthonormalized numerical atomic orbitals, with occupation numbers that sum up to the respective Quantum Theory of Atoms in Molecules (QTAIM) atomic populations. Experience shows that only a limited number of effective atomic orbitals exhibit significant occupation numbers. These c...

  11. Towards single-atom detection on a chip

    OpenAIRE

    Horak, Peter; Klappauf, Bruce G.; Haase, Albrecht; Folman, Ron; Schmiedmayer, Joerg; Domokos, Peter; Hinds, E. A.

    2002-01-01

    We investigate the optical detection of single atoms held in a microscopic atom trap close to a surface. Laser light is guided by optical fibers or optical micro-structures via the atom to a photo-detector. Our results suggest that with present-day technology, micro-cavities can be built around the atom with sufficiently high finesse to permit unambiguous detection of a single atom in the trap with 10 $\\mu$s of integration. We compare resonant and non-resonant detection schemes and we discuss...

  12. Reflections on the projection of ions in atom probe tomography

    CERN Document Server

    De Geuser, Frédéric

    2016-01-01

    There are two main projections used to transform, and reconstruct, field ion micrographs or atom probe tomography data into atomic coordinates at the specimen surface and, subsequently, in three-dimensions. In this article, we present a perspective on the strength of the azimuthal equidistant projection in comparison to the more widely used and well-established point-projection, which underpins data reconstruction in the only commercial software package available currently. After an overview of the reconstruction methodology, we demonstrate that the azimuthal equidistant is not only more accurate, but also more robust with regards to errors on the parameters used to perform the reconstruction and is therefore more likely to yield more accurate tomographic reconstructions.

  13. Microscopic Image of Martian Surface Material on a Silicone Substrate

    Science.gov (United States)

    2008-01-01

    [figure removed for brevity, see original site] Click on image for larger version of Figure 1 This image taken by the Optical Microscope on NASA's Phoenix Mars Lander shows soil sprinkled from the lander's Robot Arm scoop onto a silicone substrate. The substrate was then rotated in front of the microscope. This is the first sample collected and delivered for instrumental analysis onboard a planetary lander since NASA's Viking Mars missions of the 1970s. It is also the highest resolution image yet seen of Martian soil. The image is dominated by fine particles close to the resolution of the microscope. These particles have formed clumps, which may be a smaller scale version of what has been observed by Phoenix during digging of the surface material. The microscope took this image during Phoenix's Sol 17 (June 11), or the 17th Martian day after landing. The scale bar is 1 millimeter (0.04 inch). Zooming in on the Martian Soil In figure 1, three zoomed-in portions are shown with an image of Martian soil particles taken by the Optical Microscope on NASA's Phoenix Mars Lander. The left zoom box shows a composite particle. The top of the particle has a green tinge, possibly indicating olivine. The bottom of the particle has been reimaged at a different focus position in black and white (middle zoom box), showing that this is a clump of finer particles. The right zoom box shows a rounded, glassy particle, similar to those which have also been seen in an earlier sample of airfall dust collected on a surface exposed during landing. The shadows at the bottom of image are of the beams of the Atomic Force Microscope. The Phoenix Mission is led by the University of Arizona, Tucson, on behalf of NASA. Project management of the mission is by NASA's Jet Propulsion Laboratory, Pasadena, Calif. Spacecraft development is by Lockheed Martin Space Systems, Denver.

  14. Sub-Angstrom Atomic-Resolution Imaging of Heavy Atoms to Light Atoms

    Energy Technology Data Exchange (ETDEWEB)

    O' Keefe, Michael A.; Shao-Horn, Yang

    2003-05-23

    Three decades ago John Cowley and his group at ASU achieved high-resolution electron microscope images showing the crystal unit cell contents at better than 4Angstrom resolution. Over the years, this achievement has inspired improvements in resolution that have enabled researchers to pinpoint the positions of heavy atom columns within the cell. More recently, this ability has been extended to light atoms as resolution has improved. Sub-Angstrom resolution has enabled researchers to image the columns of light atoms (carbon, oxygen and nitrogen) that are present in many complex structures. By using sub-Angstrom focal-series reconstruction of the specimen exit surface wave to image columns of cobalt, oxygen, and lithium atoms in a transition metal oxide structure commonly used as positive electrodes in lithium rechargeable batteries, we show that the range of detectable light atoms extends to lithium. HRTEM at sub-Angstrom resolution will provide the essential role of experimental verification for the emergent nanotech revolution. Our results foreshadow those to be expected from next-generation TEMs with Cs-corrected lenses and monochromated electron beams.

  15. Microscope Project for Undergraduate Laboratories

    CERN Document Server

    Chippendale, Rachel Kemp Alexander; Shumway, Jennifer; Tan, Amanda; Zuraw, Sarah; Ross, Jennifer L

    2016-01-01

    Optics is an important subfield of physics required for instrument design and used in a variety of other disciplines, including materials science, physics, and life sciences such as developmental biology and cell biology. It is important to educate students from a variety of disciplines and backgrounds in the basics of optics in order to train the next generation of interdisciplinary researchers and instrumentalists who will push the boundaries of discovery. In this paper, we present an experimental system developed to teach students in the basics of geometric optics, including ray and wave optics. The students learn these concepts through designing, building, and testing a home-built light microscope made from component parts. We describe the experimental equipment and basic measurements students can perform to learn principles, technique, accuracy, and resolution of measurement. Students find the magnification and test the resolution of the microscope system they build. The system is open and versatile to a...

  16. Asbestos and Probable Microscopic Polyangiitis

    Directory of Open Access Journals (Sweden)

    George S Rashed Philteos

    2004-01-01

    Full Text Available Several inorganic dust lung diseases (pneumoconioses are associated with autoimmune diseases. Although autoimmune serological abnormalities are common in asbestosis, clinical autoimmune/collagen vascular diseases are not commonly reported. A case of pulmonary asbestosis complicated by perinuclear-antineutrophil cytoplasmic antibody (myeloperoxidase positive probable microscopic polyangiitis (glomerulonephritis, pericarditis, alveolitis, multineuritis multiplex is described and the possible immunological mechanisms whereby asbestosis fibres might be relevant in induction of antineutrophil cytoplasmic antibodies are reviewed in the present report.

  17. Microscopic views of drug solubility

    OpenAIRE

    Bondesson, Laban

    2006-01-01

    The development of computational models for predicting drug solubility has increased drastically during the last decades. Nevertheless these models still have diffculties to estimate the aqueous solubility as accurate as desired. In this thesis di erent aspects that are known to have a large impact on the aqueous solubility of a molecule have been studied in detail using various theoretical methods with intension to provide microscopic view on drug solubility. The rst aspect studied is the hy...

  18. Study on the Microscopic Figures of Power Transformer Insulation Paper Under Electrical and Thermal Stresses

    Science.gov (United States)

    Liao, Rui-Jin; Tang, Chao; Yang, Li-Jun

    In this paper, Atomic Force Microscope (AFM) was used to observe the microscopic figure of aged insulation paper in order to analyze the microscopic ageing mechanism of power transformer insulation paper under electrical and thermal stresses. The results indicate that there are obvious concaves and convexes on the surface of aged insulation paper, and the paper samples are punctured because of chain scission and the flow of discharge current, which destroyed the compact cellulose chains structures and the diameter of punctures is about 0.5 nm. In addition, this paper analyzed the influence to the physical chemistry characteristics of insulation paper caused by partial discharge and paper ageing.

  19. Microscope Image of Scavenged Particles

    Science.gov (United States)

    2008-01-01

    This image from NASA's Phoenix Mars Lander's Optical Microscope shows a strongly magnetic surface which has scavenged particles from within the microscope enclosure before a sample delivery from the lander's Robotic Arm. The particles correspond to the larger grains seen in fine orange material that makes up most of the soil at the Phoenix site. They vary in color, but are of similar size, about one-tenth of a millimeter. As the microscope's sample wheel moved during operation, these particles also shifted, clearing a thin layer of the finer orange particles that have also been collected. Together with the previous image, this shows that the larger grains are much more magnetic than the fine orange particles with a much larger volume of the grains being collected by the magnet. The image is 2 milimeters across. It is speculated that the orange material particles are a weathering product from the larger grains, with the weathering process both causing a color change and a loss of magnetism. The Phoenix Mission is led by the University of Arizona, Tucson, on behalf of NASA. Project management of the mission is by JPL, Pasadena, Calif. Spacecraft development was by Lockheed Martin Space Systems, Denver.

  20. Gelation on the microscopic scale

    Science.gov (United States)

    Oppong, Felix K.; Coussot, P.; de Bruyn, John R.

    2008-08-01

    Particle-tracking methods are used to study gelation in a colloidal suspension of Laponite clay particles. We track the motion of small fluorescent polystyrene spheres added to the suspension, and obtain the micron-scale viscous and elastic moduli of the material from their mean-squared displacement. The fluorescent spheres move subdiffusively due to the microstructure of the suspension, with the diffusive exponent decreasing from close to one at early times to near zero as the material gels. The particle-tracking data show that the system becomes more heterogeneous on the microscopic scale as gelation proceeds. We also determine the bulk-scale moduli using small-amplitude oscillatory shear rheometry. Both the macroscopic and microscopic moduli increase with time, and on both scales we observe a transition from a primarily viscous fluid to an elastic gel. We find that the gel point, determined as the time at which the viscous and elastic moduli are equal, is length-scale dependent—gelation occurs earlier on the bulk scale than on the microscopic scale.