Designs for a quantum electron microscope

Energy Technology Data Exchange (ETDEWEB)

Kruit, P., E-mail: p.kruit@tudelft.nl [Department of Imaging Physics, Delft University of Technology, Lorentzweg 1, 2628CJ Delft (Netherlands); Hobbs, R.G.; Kim, C-S.; Yang, Y.; Manfrinato, V.R. [Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139 (United States); Hammer, J.; Thomas, S.; Weber, P. [Department of Physics, Friedrich Alexander University Erlangen-Nürnberg (FAU), Staudtstrasse 1, d-91058 Erlangen (Germany); Klopfer, B.; Kohstall, C.; Juffmann, T.; Kasevich, M.A. [Department of Physics, Stanford University, Stanford, California 94305 (United States); Hommelhoff, P. [Department of Physics, Friedrich Alexander University Erlangen-Nürnberg (FAU), Staudtstrasse 1, d-91058 Erlangen (Germany); Berggren, K.K. [Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139 (United States)

2016-05-15

One of the astounding consequences of quantum mechanics is that it allows the detection of a target using an incident probe, with only a low probability of interaction of the probe and the target. This ‘quantum weirdness’ could be applied in the field of electron microscopy to generate images of beam-sensitive specimens with substantially reduced damage to the specimen. A reduction of beam-induced damage to specimens is especially of great importance if it can enable imaging of biological specimens with atomic resolution. Following a recent suggestion that interaction-free measurements are possible with electrons, we now analyze the difficulties of actually building an atomic resolution interaction-free electron microscope, or “quantum electron microscope”. A quantum electron microscope would require a number of unique components not found in conventional transmission electron microscopes. These components include a coherent electron beam-splitter or two-state-coupler, and a resonator structure to allow each electron to interrogate the specimen multiple times, thus supporting high success probabilities for interaction-free detection of the specimen. Different system designs are presented here, which are based on four different choices of two-state-couplers: a thin crystal, a grating mirror, a standing light wave and an electro-dynamical pseudopotential. Challenges for the detailed electron optical design are identified as future directions for development. While it is concluded that it should be possible to build an atomic resolution quantum electron microscope, we have also identified a number of hurdles to the development of such a microscope and further theoretical investigations that will be required to enable a complete interpretation of the images produced by such a microscope. - Highlights: • Quantum electron microscopy has the potential of reducing radiation damage. • QEM requires a fraction of the electron wave to pass through the sample

Designs for a quantum electron microscope

International Nuclear Information System (INIS)

Kruit, P.; Hobbs, R.G.; Kim, C-S.; Yang, Y.; Manfrinato, V.R.; Hammer, J.; Thomas, S.; Weber, P.; Klopfer, B.; Kohstall, C.; Juffmann, T.; Kasevich, M.A.; Hommelhoff, P.; Berggren, K.K.

2016-01-01

One of the astounding consequences of quantum mechanics is that it allows the detection of a target using an incident probe, with only a low probability of interaction of the probe and the target. This ‘quantum weirdness’ could be applied in the field of electron microscopy to generate images of beam-sensitive specimens with substantially reduced damage to the specimen. A reduction of beam-induced damage to specimens is especially of great importance if it can enable imaging of biological specimens with atomic resolution. Following a recent suggestion that interaction-free measurements are possible with electrons, we now analyze the difficulties of actually building an atomic resolution interaction-free electron microscope, or “quantum electron microscope”. A quantum electron microscope would require a number of unique components not found in conventional transmission electron microscopes. These components include a coherent electron beam-splitter or two-state-coupler, and a resonator structure to allow each electron to interrogate the specimen multiple times, thus supporting high success probabilities for interaction-free detection of the specimen. Different system designs are presented here, which are based on four different choices of two-state-couplers: a thin crystal, a grating mirror, a standing light wave and an electro-dynamical pseudopotential. Challenges for the detailed electron optical design are identified as future directions for development. While it is concluded that it should be possible to build an atomic resolution quantum electron microscope, we have also identified a number of hurdles to the development of such a microscope and further theoretical investigations that will be required to enable a complete interpretation of the images produced by such a microscope. - Highlights: • Quantum electron microscopy has the potential of reducing radiation damage. • QEM requires a fraction of the electron wave to pass through the sample

Science 101: How Does an Electron Microscope Work?

Science.gov (United States)

Robertson, Bill

2013-01-01

Contrary to popular opinion, electron microscopes are not used to look at electrons. They are used to look for structure in things that are too small to observe with an optical microscope, or to obtain images that are magnified much more than is obtainable with an optical microscope. To understand how electron microscopes work, it will help to go…

Integration of a high-NA light microscope in a scanning electron microscope.

Science.gov (United States)

Zonnevylle, A C; Van Tol, R F C; Liv, N; Narvaez, A C; Effting, A P J; Kruit, P; Hoogenboom, J P

2013-10-01

We present an integrated light-electron microscope in which an inverted high-NA objective lens is positioned inside a scanning electron microscope (SEM). The SEM objective lens and the light objective lens have a common axis and focal plane, allowing high-resolution optical microscopy and scanning electron microscopy on the same area of a sample simultaneously. Components for light illumination and detection can be mounted outside the vacuum, enabling flexibility in the construction of the light microscope. The light objective lens can be positioned underneath the SEM objective lens during operation for sub-10 μm alignment of the fields of view of the light and electron microscopes. We demonstrate in situ epifluorescence microscopy in the SEM with a numerical aperture of 1.4 using vacuum-compatible immersion oil. For a 40-nm-diameter fluorescent polymer nanoparticle, an intensity profile with a FWHM of 380 nm is measured whereas the SEM performance is uncompromised. The integrated instrument may offer new possibilities for correlative light and electron microscopy in the life sciences as well as in physics and chemistry. © 2013 The Authors Journal of Microscopy © 2013 Royal Microscopical Society.

Scanning electron microscope

International Nuclear Information System (INIS)

Anon.

1980-01-01

The principle underlying the design of the scanning electron microscope (SEM), the design and functioning of SEM are described. Its applications in the areas of microcircuitry and materials science are outlined. The development of SEM in India is reviewed. (M.G.B.)

Transmission electron microscope studies of phase transitions in single crystals and ceramics of ferroelectric Pb(Sc1/2Ta1/2)O3

International Nuclear Information System (INIS)

Baba-Kishi, K.Z.; Barber, D.J.

1990-01-01

An account is given of transmission electron microscope investigations of the phase transitions in single crystals and ceramics of the complex perovskite-structured ferroelectric 'relaxor' compound Pb(Sc 1/2 Ta 1/2 )O 3 . The crystal symmetries pertaining to both the non-polar paraelectric (PE) and polar ferroelectric (FE) states have been studied by the technique of convergent-beam electron diffraction. A new phase transition has been discovered in the temperature range for which the FE and PE states coexist. The new phase transition is interpreted as the creation of a modulated antiferroelectric state, and this is viewed as marking a departure from relaxor behaviour towards more 'normal' ferroelectric behaviour. (orig.)

Electron microscope studies

International Nuclear Information System (INIS)

Crewe, A.V.; Kapp, O.H.

1992-01-01

This is a report covering the research performed in the Crewe laboratory between 1964 and 1992. Because of limitations of space we have provided relatively brief summaries of the major research directions of the facility during these years. A complete bibliography has been included and we have referenced groups of pertinent publications at the beginning of each section. This report summarizes our efforts to develop better electron microscopes and chronicles many of the experimental programs, in materials science and biology, that acted both as a stimulus to better microscope design and also as a testing ground for many instrumental innovations

Electron microscope studies

Energy Technology Data Exchange (ETDEWEB)

Crewe, A.V.; Kapp, O.H.

1992-07-01

This is a report covering the research performed in the Crewe laboratory between 1964 and 1992. Because of limitations of space we have provided relatively brief summaries of the major research directions of the facility during these years. A complete bibliography has been included and we have referenced groups of pertinent publications at the beginning of each section. This report summarizes our efforts to develop better electron microscopes and chronicles many of the experimental programs, in materials science and biology, that acted both as a stimulus to better microscope design and also as a testing ground for many instrumental innovations.

Vibrational spectroscopy in the electron microscope.

Science.gov (United States)

Krivanek, Ondrej L; Lovejoy, Tracy C; Dellby, Niklas; Aoki, Toshihiro; Carpenter, R W; Rez, Peter; Soignard, Emmanuel; Zhu, Jiangtao; Batson, Philip E; Lagos, Maureen J; Egerton, Ray F; Crozier, Peter A

2014-10-09

Vibrational spectroscopies using infrared radiation, Raman scattering, neutrons, low-energy electrons and inelastic electron tunnelling are powerful techniques that can analyse bonding arrangements, identify chemical compounds and probe many other important properties of materials. The spatial resolution of these spectroscopies is typically one micrometre or more, although it can reach a few tens of nanometres or even a few ångströms when enhanced by the presence of a sharp metallic tip. If vibrational spectroscopy could be combined with the spatial resolution and flexibility of the transmission electron microscope, it would open up the study of vibrational modes in many different types of nanostructures. Unfortunately, the energy resolution of electron energy loss spectroscopy performed in the electron microscope has until now been too poor to allow such a combination. Recent developments that have improved the attainable energy resolution of electron energy loss spectroscopy in a scanning transmission electron microscope to around ten millielectronvolts now allow vibrational spectroscopy to be carried out in the electron microscope. Here we describe the innovations responsible for the progress, and present examples of applications in inorganic and organic materials, including the detection of hydrogen. We also demonstrate that the vibrational signal has both high- and low-spatial-resolution components, that the first component can be used to map vibrational features at nanometre-level resolution, and that the second component can be used for analysis carried out with the beam positioned just outside the sample--that is, for 'aloof' spectroscopy that largely avoids radiation damage.

Electron irradiation-induced destruction of carbon nanotubes in electron microscopes

International Nuclear Information System (INIS)

Molhave, Kristian; Gudnason, Sven Bjarke; Pedersen, Anders Tegtmeier; Clausen, Casper Hyttel; Horsewell, Andy; Boggild, Peter

2007-01-01

Observations of carbon nanotubes under exposure to electron beam irradiation in standard transmission electron microscope (TEM) and scanning electron microscope (SEM) systems show that such treatment in some cases can cause severe damage of the nanotube structure, even at electron energies far below the approximate 100 keV threshold for knock-on damage displacing carbon atoms in the graphene structure. We find that the damage we observe in one TEM can be avoided by use of a cold finger. This and the morphology of the damage imply that water vapour, which is present as a background gas in many vacuum chambers, can damage the nanotube structure through electron beam-induced chemical reactions. Though, the dependence on the background gas makes these observations specific for the presently used systems, the results demonstrate the importance of careful assessment of the level of subtle structural damage that the individual electron microscope system can do to nanostructures during standard use

Enhanced phase contrast transfer using ptychography combined with a pre-specimen phase plate in a scanning transmission electron microscope

Energy Technology Data Exchange (ETDEWEB)

Yang, Hao; Ercius, Peter [Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States); Nellist, Peter D. [Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH (United Kingdom); Ophus, Colin, E-mail: clophus@lbl.gov [Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States)

2016-12-15

The ability to image light elements in both crystalline and noncrystalline materials at near atomic resolution with an enhanced contrast is highly advantageous to understand the structure and properties of a wide range of beam sensitive materials including biological specimens and molecular hetero-structures. This requires the imaging system to have an efficient phase contrast transfer at both low and high spatial frequencies. In this work we introduce a new phase contrast imaging method in a scanning transmission electron microscope (STEM) using a pre-specimen phase plate in the probe forming aperture, combined with a fast pixelated detector to record diffraction patterns at every probe position, and phase reconstruction using ptychography. The phase plate significantly enhances the contrast transfer of low spatial frequency information, and ptychography maximizes the extraction of the phase information at all spatial frequencies. In addition, the STEM probe with the presence of the phase plate retains its atomic resolution, allowing simultaneous incoherent Z-contrast imaging to be obtained along with the ptychographic phase image. An experimental image of Au nanoparticles on a carbon support shows high contrast for both materials. Multislice image simulations of a DNA molecule shows the capability of imaging soft matter at low dose conditions, which implies potential applications of low dose imaging of a wide range of beam sensitive materials. - Highlights: • This work demonstrates a phase contrast imaging method by combining a pre-specimen phase plate with ptychogrpahy. • This method is shown to have a high phase contrast transfer efficiency at both low and high spatial frequencies. • Unlike CTEM which uses a heavy defocus to gain contrast, the phase plate gives a linear phase contrast at zero defocus aberrations. • Image simulations of DNA suggest this method is highly attractive for imaging beam sensitive materials at a low dose.

Microscopic Electron Dynamics in Metal Nanoparticles for Photovoltaic Systems

Directory of Open Access Journals (Sweden)

Katarzyna Kluczyk

2018-06-01

Full Text Available Nanoparticles—regularly patterned or randomly dispersed—are a key ingredient for emerging technologies in photonics. Of particular interest are scattering and field enhancement effects of metal nanoparticles for energy harvesting and converting systems. An often neglected aspect in the modeling of nanoparticles are light interaction effects at the ultimate nanoscale beyond classical electrodynamics. Those arise from microscopic electron dynamics in confined systems, the accelerated motion in the plasmon oscillation and the quantum nature of the free electron gas in metals, such as Coulomb repulsion and electron diffusion. We give a detailed account on free electron phenomena in metal nanoparticles and discuss analytic expressions stemming from microscopic (Random Phase Approximation—RPA and semi-classical (hydrodynamic theories. These can be incorporated into standard computational schemes to produce more reliable results on the optical properties of metal nanoparticles. We combine these solutions into a single framework and study systematically their joint impact on isolated Au, Ag, and Al nanoparticles as well as dimer structures. The spectral position of the plasmon resonance and its broadening as well as local field enhancement show an intriguing dependence on the particle size due to the relevance of additional damping channels.

Atomistic observations and analyses of lattice defects in transmission electron microscopes

CERN Document Server

Abe, H

2003-01-01

The transmission electron microscope (TEM) -accelerators was developed. TEM-Accelerator made possible to observe in situ experiments of ion irradiation and implantation. The main results are the experimental proof of new lattice defects by irradiation, the formation process and synthesized conditions of carbon onion by ion implantation, the microstructure and phase transformation conditions of graphite by ion irradiated phase transformation, the irradiation damage formation process by simultaneous irradiation of electron and ion and behavior of fullerene whisker under irradiation. The microstructural evolution of defect clusters in copper irradiated with 240-keV Cu sup + ions and a high resolution electron micrograph of carbon onions synthesized by ion implantation are explained as the examples of recent researches. (S.Y.)

Scanning Auger Electron Microscope

Data.gov (United States)

Federal Laboratory Consortium — A JEOL model 7830F field emission source, scanning Auger microscope.Specifications / Capabilities:Ultra-high vacuum (UHV), electron gun range from 0.1 kV to 25 kV,...

Nonequilibrium segregation and phase instability in alloy films during elevated-temperature irradiation in a high-voltage electron microscope

Science.gov (United States)

Lam, N. Q.; Okamoto, P. R.

1984-05-01

The effects of defect-production rate gradients, caused by the radial nonuniformity in the electron flux distribution, on solute segregation and phase stability in alloy films undergoing high-voltage electron-microscope (HVEM) irradiation at high temperatures are assessed. Two-dimensional (axially symmetric) compositional redistributions were calculated, taking into account both axial and transverse radial defect fluxes. It was found that when highly focused beams were employed radiation-induced segregation consisted of two stages: dominant axial segregation at the film surfaces at short irradiation times and competitive radial segregation at longer times. The average alloy composition within the irradiated region could differ greatly from that irradiated with a uniform beam, because of the additional atom transport from or to the region surrounding the irradiated zone under the influence of radial fluxes. Damage-rate gradient effects must be taken into account when interpreting in-situ HVEM observations of segregation-induced phase instabilities. The theoretical predictions are compared with experimental observations of the temporal and spatial dependence of segregation-induced precipitation in thin films of Ni-Al, Ni-Ge and Ni-Si solid solutions.

Pulsed Power for a Dynamic Transmission Electron Microscope

Energy Technology Data Exchange (ETDEWEB)

dehope, w j; browning, n; campbell, g; cook, e; king, w; lagrange, t; reed, b; stuart, b; Shuttlesworth, R; Pyke, B

2009-06-25

Lawrence Livermore National Laboratory (LLNL) has converted a commercial 200kV transmission electron microscope (TEM) into an ultrafast, nanoscale diagnostic tool for material science studies. The resulting Dynamic Transmission Electron Microscope (DTEM) has provided a unique tool for the study of material phase transitions, reaction front analyses, and other studies in the fields of chemistry, materials science, and biology. The TEM's thermionic electron emission source was replaced with a fast photocathode and a laser beam path was provided for ultraviolet surface illumination. The resulting photoelectron beam gives downstream images of 2 and 20 ns exposure times at 100 and 10 nm spatial resolution. A separate laser, used as a pump pulse, is used to heat, ignite, or shock samples while the photocathode electron pulses, carefully time-synchronized with the pump, function as probe in fast transient studies. The device functions in both imaging and diffraction modes. A laser upgrade is underway to make arbitrary cathode pulse trains of variable pulse width of 10-1000 ns. Along with a fast e-beam deflection scheme, a 'movie mode' capability will be added to this unique diagnostic tool. This talk will review conventional electron microscopy and its limitations, discuss the development and capabilities of DTEM, in particularly addressing the prime and pulsed power considerations in the design and fabrication of the DTEM, and conclude with the presentation of a deflector and solid-state pulser design for Movie-Mode DTEM.

Pulsed Power for a Dynamic Transmission Electron Microscope

International Nuclear Information System (INIS)

DeHope, W.J.; Browning, N.; Campbell, G.; Cook, E.; King, W.; Lagrange, T.; Reed, B.; Stuart, B.; Shuttlesworth, R.; Pyke, B.

2009-01-01

Lawrence Livermore National Laboratory (LLNL) has converted a commercial 200kV transmission electron microscope (TEM) into an ultrafast, nanoscale diagnostic tool for material science studies. The resulting Dynamic Transmission Electron Microscope (DTEM) has provided a unique tool for the study of material phase transitions, reaction front analyses, and other studies in the fields of chemistry, materials science, and biology. The TEM's thermionic electron emission source was replaced with a fast photocathode and a laser beam path was provided for ultraviolet surface illumination. The resulting photoelectron beam gives downstream images of 2 and 20 ns exposure times at 100 and 10 nm spatial resolution. A separate laser, used as a pump pulse, is used to heat, ignite, or shock samples while the photocathode electron pulses, carefully time-synchronized with the pump, function as probe in fast transient studies. The device functions in both imaging and diffraction modes. A laser upgrade is underway to make arbitrary cathode pulse trains of variable pulse width of 10-1000 ns. Along with a fast e-beam deflection scheme, a 'movie mode' capability will be added to this unique diagnostic tool. This talk will review conventional electron microscopy and its limitations, discuss the development and capabilities of DTEM, in particularly addressing the prime and pulsed power considerations in the design and fabrication of the DTEM, and conclude with the presentation of a deflector and solid-state pulser design for Movie-Mode DTEM

Polarized differential-phase laser scanning microscope

International Nuclear Information System (INIS)

Chou Chien; Lyu, C.-W.; Peng, L.-C.

2001-01-01

A polarized differential-phase laser scanning microscope, which combines a polarized optical heterodyne Mach-Zehnder interferometer and a differential amplifier to scan the topographic image of a surface, is proposed. In the experiment the differential amplifier, which acts as a PM-AM converter, in the experiment, converting phase modulation (PM) into amplitude modulation (AM). Then a novel, to our knowledge, phase demodulator was proposed and implemented for the differential-phase laser scanning microscope. An optical grating (1800 lp/mm) was imaged. The lateral and the depth resolutions of the imaging system were 0.5 μm and 1 nm, respectively. The detection accuracy, which was limited by the reflectivity variation of the test surface, is discussed

Electron optical characteristics of a concave electrostatic electron mirror for a scanning electron microscope

International Nuclear Information System (INIS)

Hamarat, R.T.; Witzani, J.; Hoerl, E.M.

1984-08-01

Numerical computer calculations are used to explore the design characteristics of a concave electrostatic electron mirror for a mirror attachment for a conventional scanning electron microscope or an instrument designed totally as a scanning electron mirror microscope. The electron paths of a number of set-ups are calculated and drawn graphically in order to find the optimum shape and dimensions of the mirror geometry. This optimum configuration turns out to be the transition configuration between two cases of electron path deflection, towards the optical axis of the system and away from it. (Author)

Crystal structure and defects of Zr4Co4Si7( V-phase) investigated by high resolution transmission electron microscope

International Nuclear Information System (INIS)

Mao, J.F.; Ye, H.Q.; Ning, X.G.; He, L.L.; Yang, D.Z.

1997-01-01

The results of high resolution transmission electron microscope (HRTEM) observation and image simulation show that Zr 4 Co 4 Si 7 possesses the same structure type of Zr 4 Co 4 Ge 7 . Adding of Fe or Ni into the Zr 4 Co 4 Si 7 compound, except that the dimensions changed slightly, does not change the lattice type and coordination in the crystal structure, maintaining the V-phase structure. Also, twins with coherent boundaries and with partially coherent at interfaces are observed. The image conditions of Zr 4 Co 4 Si 7 and the structure differences between Zr 4 Co 4 Si 7 and tetrahedral close-packed phases are also discussed. copyright 1997 Materials Research Society

An electron microscope for the aberration-corrected era

Energy Technology Data Exchange (ETDEWEB)

Krivanek, O.L. [Nion Co., 1102 8th Street, Kirkland, WA 98033 (United States)], E-mail: krivanek.ondrej@gmail.com; Corbin, G.J.; Dellby, N.; Elston, B.F.; Keyse, R.J.; Murfitt, M.F.; Own, C.S.; Szilagyi, Z.S.; Woodruff, J.W. [Nion Co., 1102 8th Street, Kirkland, WA 98033 (United States)

2008-02-15

Improved resolution made possible by aberration correction has greatly increased the demands on the performance of all parts of high-end electron microscopes. In order to meet these demands, we have designed and built an entirely new scanning transmission electron microscope (STEM). The microscope includes a flexible illumination system that allows the properties of its probe to be changed on-the-fly, a third-generation aberration corrector which corrects all geometric aberrations up to fifth order, an ultra-responsive yet stable five-axis sample stage, and a flexible configuration of optimized detectors. The microscope features many innovations, such as a modular column assembled from building blocks that can be stacked in almost any order, in situ storage and cleaning facilities for up to five samples, computer-controlled loading of samples into the column, and self-diagnosing electronics. The microscope construction is described, and examples of its capabilities are shown.

An electron microscope for the aberration-corrected era

International Nuclear Information System (INIS)

Krivanek, O.L.; Corbin, G.J.; Dellby, N.; Elston, B.F.; Keyse, R.J.; Murfitt, M.F.; Own, C.S.; Szilagyi, Z.S.; Woodruff, J.W.

2008-01-01

Improved resolution made possible by aberration correction has greatly increased the demands on the performance of all parts of high-end electron microscopes. In order to meet these demands, we have designed and built an entirely new scanning transmission electron microscope (STEM). The microscope includes a flexible illumination system that allows the properties of its probe to be changed on-the-fly, a third-generation aberration corrector which corrects all geometric aberrations up to fifth order, an ultra-responsive yet stable five-axis sample stage, and a flexible configuration of optimized detectors. The microscope features many innovations, such as a modular column assembled from building blocks that can be stacked in almost any order, in situ storage and cleaning facilities for up to five samples, computer-controlled loading of samples into the column, and self-diagnosing electronics. The microscope construction is described, and examples of its capabilities are shown

Light and scanning electron microscopic examination of hair in Garlic's syndrome

International Nuclear Information System (INIS)

Celik, Hakan H.; Tunali, S.; Tatar, I.; Aldur, Muhammad M.; Tore, H.

2007-01-01

Grisceli syndrome is a rare disease is a rare disease characterized by pigment dilution, partial albinism, variable cellular immunodeficiency and an acute phase of uncontrolled T-lymphocyte macrophage activation. Griscelli et al described this syndrome in 1978. Since then, only approximately, 60 cases have been reported, most from Turkish and Mediterranean population. In microscopic examination, silvery grey hair with large clumped melanosomes on the hair shaft is the diagnostic finding. Here, we present scanning electron microscopic study of hair in 2 cases of Griscelli syndrome where the hair showed normal cuticular pattern but nodular structures were present as an abnormal finding. (author)

Electron microscopic observation at low temperature on superconductors

International Nuclear Information System (INIS)

Yokota, Yasuhiro; Hashimoto, Hatsujiro; Yoshida, Hiroyuki.

1991-01-01

The authors have observed superconducting materials with a high resolution electron microscope at liquid helium temperature. First, observation was carried out on Nb system intermetallic compounds such as Nb 3 Al and Nb 3 Sn of Al 5 type and Nb 3 Ge of 11 type at extremely low temperature. Next, the observation of high temperature superconductive ceramics in the state of superconductivity was attempted. In this paper, first the development of the liquid helium sample holder for a 400 kV electron microscope to realize the observation is reported. Besides, the sample holder of Gatan Co. and an extremely low temperature, high resolution electron microscope with a superconducting lens are described. The purpose of carrying out the electron microscope observation of superconductors at low temperature is the direct observation of the crystalline lattice image in the state of superconductivity. Also the structural transformation from tetragonal crystals to rhombic crystals in Al 5 type superconductors can be observed. The results of observation are reported. (K.I.)

On the resolution of the electron microscopic radioautography

International Nuclear Information System (INIS)

Uchida, Kazuko; Daimon, Tateo; Kawai, Kazuhiro

1981-01-01

The aim of electron microscopic radioautography is to reveal the exact localization of certain substances at the macromolecular level. In order to attain this object the establishment of a fine grain development method is indispensable. Some of latent images are formed at the contact surface between the polyhedral halide silver grain and the section surface, where the impact of #betta# particles come directly from the section involved, and since it is in contact with the section it remains in place even after development and gelatin removal. This latent image finally becomes a developed silver grain in the electron microscope radioautogram. Although the limit of resolution in electron microscopic radioautography is supposed to be the diameter of halide silver grains in emulsion, it may be improved by considering the fact that the contact area between the halide silver grain and the section surface is the minimum unit of resolution. The minimum resolution of electron microscopic radioautography was determined histologically to be about 100A. (author)

Nonequilibrium segregation and phase instability in alloy films during elevated-temperature irradiation in a high-voltage electron microscope

International Nuclear Information System (INIS)

Lam, N.Q.; Okamoto, P.R.

1984-05-01

The effects of defect-production rate gradients, caused by the radial nonuniformity in the electron flux distribution, on solute segregation and phase stability in alloy films undergoing high-voltage electron-microscope (HVEM) irradiation at high temperatures are assessed. Two-dimensional (axially symmetric) compositional redistributions were calculated, taking into account both axial and transverse radial defect fluxes. It was found that when highly focused beams were employed radiation-induced segregation consisted of two stages: dominant axial segregation at the film surfaces at short irradiation times and competitive radial segregation at longer times. The average alloy composition within the irradiated region could differ greatly from that irradiated with a uniform beam, because of the additional atom transport from or to the region surrounding the irradiated zone under the influence of radial fluxes. As a result, damage-rate gradient effects must be taken into account when interpreting in-situ HVEM observations of segregation-induced phase instabilities. The theoretical predictions are compared with experimental observations of the temporal and spatial dependence of segregation-induced precipitation in thin films of Ni-Al, Ni-Ge and Ni-Si solid solutions

Atmospheric scanning electron microscope for correlative microscopy.

Science.gov (United States)

Morrison, Ian E G; Dennison, Clare L; Nishiyama, Hidetoshi; Suga, Mitsuo; Sato, Chikara; Yarwood, Andrew; O'Toole, Peter J

2012-01-01

The JEOL ClairScope is the first truly correlative scanning electron and optical microscope. An inverted scanning electron microscope (SEM) column allows electron images of wet samples to be obtained in ambient conditions in a biological culture dish, via a silicon nitride film window in the base. A standard inverted optical microscope positioned above the dish holder can be used to take reflected light and epifluorescence images of the same sample, under atmospheric conditions that permit biochemical modifications. For SEM, the open dish allows successive staining operations to be performed without moving the holder. The standard optical color camera used for fluorescence imaging can be exchanged for a high-sensitivity monochrome camera to detect low-intensity fluorescence signals, and also cathodoluminescence emission from nanophosphor particles. If these particles are applied to the sample at a suitable density, they can greatly assist the task of perfecting the correlation between the optical and electron images. Copyright © 2012 Elsevier Inc. All rights reserved.

Forensic Scanning Electron Microscope

Science.gov (United States)

Keeley, R. H.

1983-03-01

The scanning electron microscope equipped with an x-ray spectrometer is a versatile instrument which has many uses in the investigation of crime and preparation of scientific evidence for the courts. Major applications include microscopy and analysis of very small fragments of paint, glass and other materials which may link an individual with a scene of crime, identification of firearms residues and examination of questioned documents. Although simultaneous observation and chemical analysis of the sample is the most important feature of the instrument, other modes of operation such as cathodoluminescence spectrometry, backscattered electron imaging and direct x-ray excitation are also exploited. Marks on two bullets or cartridge cases can be compared directly by sequential scanning with a single beam or electronic linkage of two instruments. Particles of primer residue deposited on the skin and clothing when a gun is fired can be collected on adhesive tape and identified by their morphology and elemental composition. It is also possible to differentiate between the primer residues of different types of ammunition. Bullets may be identified from the small fragments left behind as they pass through the body tissues. In the examination of questioned documents the scanning electron microscope is used to establish the order in which two intersecting ink lines were written and to detect traces of chemical markers added to the security inks on official documents.

Electron Microscope Center Opens at Berkeley.

Science.gov (United States)

Robinson, Arthur L.

1981-01-01

A 1.5-MeV High Voltage Electron Microscope has been installed at the Lawrence Berkeley Laboratory which will help materials scientists and biologists study samples in more true-to-life situations. A 1-MeV Atomic Resolution Microscope will be installed at the same location in two years which will allow scientists to distinguish atoms. (DS)

Transmission electron microscope interfaced with ion accelerators and its application to materials science

Energy Technology Data Exchange (ETDEWEB)

Abe, Hiroaki; Naramoto, Hiroshi [Japan Atomic Energy Research Inst., Takasaki, Gunma (Japan). Takasaki Radiation Chemistry Research Establishment; Hojou, Kiichi; Furuno, Shigemi; Tsukamoto, Tetsuo

1997-03-01

We have developed the transmission/analytical electron microscope interfaced with two sets of ion accelerators (TEM-Accelerators Facility) at JAERI-Takasaki. The facility is expected to provide quantitative insights into radiation effects, such as damage evolution, irradiation-induced phase transformation and their stability, through in-situ observation and analysis under ion and/or electron irradiation. The TEM-Accelerators Facility and its application to materials research are reviewed. (author)

Portable smartphone based quantitative phase microscope

Science.gov (United States)

Meng, Xin; Tian, Xiaolin; Yu, Wei; Kong, Yan; Jiang, Zhilong; Liu, Fei; Xue, Liang; Liu, Cheng; Wang, Shouyu

2018-01-01

To realize portable device with high contrast imaging capability, we designed a quantitative phase microscope using transport of intensity equation method based on a smartphone. The whole system employs an objective and an eyepiece as imaging system and a cost-effective LED as illumination source. A 3-D printed cradle is used to align these components. Images of different focal planes are captured by manual focusing, followed by calculation of sample phase via a self-developed Android application. To validate its accuracy, we first tested the device by measuring a random phase plate with known phases, and then red blood cell smear, Pap smear, broad bean epidermis sections and monocot root were also measured to show its performance. Owing to its advantages as accuracy, high-contrast, cost-effective and portability, the portable smartphone based quantitative phase microscope is a promising tool which can be future adopted in remote healthcare and medical diagnosis.

Practical aspects of Boersch phase contrast electron microscopy of biological specimens

Energy Technology Data Exchange (ETDEWEB)

Walter, Andreas [Max-Planck-Institute of Biophysics, Department of Structural Biology, Max-von-Laue-Str. 3, D-60439 Frankfurt (Germany); Muzik, Heiko; Vieker, Henning; Turchanin, Andrey; Beyer, Andre; Goelzhaeuser, Armin [University of Bielefeld, Physics of Supramolecular Systems and Surfaces, Universitaetsstr. 25, D-33615 Bielefeld (Germany); Lacher, Manfred; Steltenkamp, Siegfried; Schmitz, Sam; Holik, Peter [Caesar Research Center, Ludwig-Erhard-Allee 2, D-53175 Bonn (Germany); Kuehlbrandt, Werner [Max-Planck-Institute of Biophysics, Department of Structural Biology, Max-von-Laue-Str. 3, D-60439 Frankfurt (Germany); Rhinow, Daniel, E-mail: daniel.rhinow@biophys.mpg.de [Max-Planck-Institute of Biophysics, Department of Structural Biology, Max-von-Laue-Str. 3, D-60439 Frankfurt (Germany)

2012-05-15

Implementation of physical phase plates into transmission electron microscopes to achieve in-focus contrast for ice-embedded biological specimens poses several technological challenges. During the last decade several phase plates designs have been introduced and tested for electron cryo-microscopy (cryoEM), including thin film (Zernike) phase plates and electrostatic devices. Boersch phase plates (BPPs) are electrostatic einzel lenses shifting the phase of the unscattered beam by an arbitrary angle. Adjusting the phase shift to 90 Degree-Sign achieves the maximum contrast transfer for phase objects such as biomolecules. Recently, we reported the implementation of a BPP into a dedicated phase contrast aberration-corrected electron microscope (PACEM) and demonstrated its use to generate in-focus contrast of frozen-hydrated specimens. However, a number of obstacles need to be overcome before BPPs can be used routinely, mostly related to the phase plate devices themselves. CryoEM with a physical phase plate is affected by electrostatic charging, obliteration of low spatial frequencies, and mechanical drift. Furthermore, BPPs introduce single sideband contrast (SSB), due to the obstruction of Friedel mates in the diffraction pattern. In this study we address the technical obstacles in detail and show how they may be overcome. We use X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) to identify contaminants responsible for electrostatic charging, which occurs with most phase plates. We demonstrate that obstruction of low-resolution features is significantly reduced by lowering the acceleration voltage of the microscope. Finally, we present computational approaches to correct BPP images for SSB contrast and to compensate for mechanical drift of the BPP. -- Highlights: Black-Right-Pointing-Pointer Various obstacles need to be overcome before Boersch phase plates can be used routinely. Black-Right-Pointing-Pointer Technical problems include

Practical aspects of Boersch phase contrast electron microscopy of biological specimens

International Nuclear Information System (INIS)

Walter, Andreas; Muzik, Heiko; Vieker, Henning; Turchanin, Andrey; Beyer, André; Gölzhäuser, Armin; Lacher, Manfred; Steltenkamp, Siegfried; Schmitz, Sam; Holik, Peter; Kühlbrandt, Werner; Rhinow, Daniel

2012-01-01

Implementation of physical phase plates into transmission electron microscopes to achieve in-focus contrast for ice-embedded biological specimens poses several technological challenges. During the last decade several phase plates designs have been introduced and tested for electron cryo-microscopy (cryoEM), including thin film (Zernike) phase plates and electrostatic devices. Boersch phase plates (BPPs) are electrostatic einzel lenses shifting the phase of the unscattered beam by an arbitrary angle. Adjusting the phase shift to 90° achieves the maximum contrast transfer for phase objects such as biomolecules. Recently, we reported the implementation of a BPP into a dedicated phase contrast aberration-corrected electron microscope (PACEM) and demonstrated its use to generate in-focus contrast of frozen–hydrated specimens. However, a number of obstacles need to be overcome before BPPs can be used routinely, mostly related to the phase plate devices themselves. CryoEM with a physical phase plate is affected by electrostatic charging, obliteration of low spatial frequencies, and mechanical drift. Furthermore, BPPs introduce single sideband contrast (SSB), due to the obstruction of Friedel mates in the diffraction pattern. In this study we address the technical obstacles in detail and show how they may be overcome. We use X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) to identify contaminants responsible for electrostatic charging, which occurs with most phase plates. We demonstrate that obstruction of low-resolution features is significantly reduced by lowering the acceleration voltage of the microscope. Finally, we present computational approaches to correct BPP images for SSB contrast and to compensate for mechanical drift of the BPP. -- Highlights: ► Various obstacles need to be overcome before Boersch phase plates can be used routinely. ► Technical problems include electrostatic charging, mechanical drift, and image artefacts. �

Development of Scanning Ultrafast Electron Microscope Capability.

Energy Technology Data Exchange (ETDEWEB)

Collins, Kimberlee Chiyoko [Sandia National Lab. (SNL-CA), Livermore, CA (United States); Talin, Albert Alec [Sandia National Lab. (SNL-CA), Livermore, CA (United States); Chandler, David W. [Sandia National Lab. (SNL-CA), Livermore, CA (United States); Michael, Joseph R. [Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)

2016-11-01

Modern semiconductor devices rely on the transport of minority charge carriers. Direct examination of minority carrier lifetimes in real devices with nanometer-scale features requires a measurement method with simultaneously high spatial and temporal resolutions. Achieving nanometer spatial resolutions at sub-nanosecond temporal resolution is possible with pump-probe methods that utilize electrons as probes. Recently, a stroboscopic scanning electron microscope was developed at Caltech, and used to study carrier transport across a Si p-n junction [ 1 , 2 , 3 ] . In this report, we detail our development of a prototype scanning ultrafast electron microscope system at Sandia National Laboratories based on the original Caltech design. This effort represents Sandia's first exploration into ultrafast electron microscopy.

Irradiation-related amorphization and crystallization: In situ transmission electron microscope studies

International Nuclear Information System (INIS)

Allen, C.W.

1994-01-01

Interfacing an ion accelerator to a transmission electron microscope (TEM) allows the analytical functions of TEM imaging and diffraction to be employed during ion-irradiation effects studies. At present there are twelve such installations in Japan, one in France and one in the US. This paper treats several aspects of in situ studies involving electron and ion beam induced and enhanced phase transformations and presents results of several in situ experiments to illustrate the dynamics of this approach in the materials science of irradiation effects. The paper describes the ion- and electron-induced amorphization of CuTi; the ion-irradiation-enhanced transformation of TiCr 2 ; and the ion- and electron-irradiation-enhanced crystallization of CoSi 2

Examples of electrostatic electron optics: The Farrand and Elektros microscopes and electron mirrors

International Nuclear Information System (INIS)

Hawkes, P.W.

2012-01-01

The role of Gertrude Rempfer in the design of the Farrand and Elektros microscopes is evoked. The study of electron mirror optics, aberration correction using mirrors and the development of microscopes employing electron mirrors are recapitulated, accompanied by a full bibliography, of earlier publications in particular.

Zernike phase-contrast electron cryotomography applied to marine cyanobacteria infected with cyanophages.

Science.gov (United States)

Dai, Wei; Fu, Caroline; Khant, Htet A; Ludtke, Steven J; Schmid, Michael F; Chiu, Wah

2014-11-01

Advances in electron cryotomography have provided new opportunities to visualize the internal 3D structures of a bacterium. An electron microscope equipped with Zernike phase-contrast optics produces images with markedly increased contrast compared with images obtained by conventional electron microscopy. Here we describe a protocol to apply Zernike phase plate technology for acquiring electron tomographic tilt series of cyanophage-infected cyanobacterial cells embedded in ice, without staining or chemical fixation. We detail the procedures for aligning and assessing phase plates for data collection, and methods for obtaining 3D structures of cyanophage assembly intermediates in the host by subtomogram alignment, classification and averaging. Acquiring three or four tomographic tilt series takes ∼12 h on a JEM2200FS electron microscope. We expect this time requirement to decrease substantially as the technique matures. The time required for annotation and subtomogram averaging varies widely depending on the project goals and data volume.

Role of scanning electron microscope )SEM) in metal failure analysis

International Nuclear Information System (INIS)

Shaiful Rizam Shamsudin; Hafizal Yazid; Mohd Harun; Siti Selina Abd Hamid; Nadira Kamarudin; Zaiton Selamat; Mohd Shariff Sattar; Muhamad Jalil

2005-01-01

Scanning electron microscope (SEM) is a scientific instrument that uses a beam of highly energetic electrons to examine the surface and phase distribution of specimens on a micro scale through the live imaging of secondary electrons (SE) and back-scattered electrons (BSE) images. One of the main activities of SEM Laboratory at MINT is for failure analysis on metal part and components. The capability of SEM is excellent for determining the root cause of metal failures such as ductility or brittleness, stress corrosion, fatigue and other types of failures. Most of our customers that request for failure analysis are from local petrochemical plants, manufacturers of automotive components, pipeline maintenance personnel and engineers who involved in the development of metal parts and component. This paper intends to discuss some of the technical concepts in failure analysis associated with SEM. (Author)

Investigations and characterization of the microstructure of special ceramic materials using the high-resolution electron microscope

International Nuclear Information System (INIS)

Kirn, M.

1979-01-01

The possibilities to characterize phases and microstructures by direct lattice imaging are indicated in the following work. Ceramic materials are particularly suitable for this as these exhibit a high mechanical stability in the investigation in the transmission electron microscope. First of all the fundamentals of the high-resolution electron microscopy are introduced and the various resulting possibilities to characterize microstructures are presented. A report then follows on experimental observations on undisturbed crystals of special ceramics on a Si 3 N 4 basis. Furthermore, it is shown that the high-resolution electron microscope provides valuable contributions to the determination of structure, in particular of twin variants. Finally, revealing information on the structure of the interfaces was obtained with the help of high-resolution electron microscopy. (orig./IHOE) [de

Electron beam excitation assisted optical microscope with ultra-high resolution.

Science.gov (United States)

Inami, Wataru; Nakajima, Kentaro; Miyakawa, Atsuo; Kawata, Yoshimasa

2010-06-07

We propose electron beam excitation assisted optical microscope, and demonstrated its resolution higher than 50 nm. In the microscope, a light source in a few nanometers size is excited by focused electron beam in a luminescent film. The microscope makes it possible to observe dynamic behavior of living biological specimens in various surroundings, such as air or liquids. Scan speed of the nanometric light source is faster than that in conventional near-field scanning optical microscopes. The microscope enables to observe optical constants such as absorption, refractive index, polarization, and their dynamic behavior on a nanometric scale. The microscope opens new microscopy applications in nano-technology and nano-science.

Theoretical study of ferroelectric nanoparticles using phase reconstructed electron microscopy

Science.gov (United States)

Phatak, C.; Petford-Long, A. K.; Beleggia, M.; De Graef, M.

2014-06-01

Ferroelectric nanostructures are important for a variety of applications in electronic and electro-optical devices, including nonvolatile memories and thin-film capacitors. These applications involve stability and switching of polarization using external stimuli, such as electric fields. We present a theoretical model describing how the shape of a nanoparticle affects its polarization in the absence of screening charges, and quantify the electron-optical phase shift for detecting ferroelectric signals with phase-sensitive techniques in a transmission electron microscope. We provide an example phase shift computation for a uniformly polarized prolate ellipsoid with varying aspect ratio in the absence of screening charges.

Prospects for electron beam aberration correction using sculpted phase masks

Energy Technology Data Exchange (ETDEWEB)

Shiloh, Roy, E-mail: royshilo@post.tau.ac.il; Remez, Roei; Arie, Ady

2016-04-15

Technological advances in fabrication methods allowed the microscopy community to take incremental steps towards perfecting the electron microscope, and magnetic lens design in particular. Still, state of the art aberration-corrected microscopes are yet 20–30 times shy of the theoretical electron diffraction limit. Moreover, these microscopes consume significant physical space and are very expensive. Here, we show how a thin, sculpted membrane is used as a phase-mask to induce specific aberrations into an electron beam probe in a standard high resolution TEM. In particular, we experimentally demonstrate beam splitting, two-fold astigmatism, three-fold astigmatism, and spherical aberration. - Highlights: • Thin membranes can be used as aberration correctors in electron columns. • We demonstrate tilt, twofold-, threefold-astigmatism, and spherical aberrations. • Experimental and physical-optics simulation results are in good agreement. • Advantages in cost, size, nonmagnetism, and nearly-arbitrary correction.

Criterion for traffic phases in single vehicle data and empirical test of a microscopic three-phase traffic theory

International Nuclear Information System (INIS)

Kerner, Boris S; Klenov, Sergey L; Hiller, Andreas

2006-01-01

Based on empirical and numerical microscopic analyses, the physical nature of a qualitatively different behaviour of the wide moving jam phase in comparison with the synchronized flow phase-microscopic traffic flow interruption within the wide moving jam phase-is found. A microscopic criterion for distinguishing the synchronized flow and wide moving jam phases in single vehicle data measured at a single freeway location is presented. Based on this criterion, empirical microscopic classification of different local congested traffic states is performed. Simulations made show that the microscopic criterion and macroscopic spatiotemporal objective criteria lead to the same identification of the synchronized flow and wide moving jam phases in congested traffic. Microscopic models in the context of three-phase traffic theory have been tested based on the microscopic criterion for the phases in congested traffic. It is found that microscopic three-phase traffic models can explain both microscopic and macroscopic empirical congested pattern features. It is obtained that microscopic frequency distributions for vehicle speed difference as well as fundamental diagrams and speed correlation functions can depend on the spatial co-ordinate considerably. It turns out that microscopic optimal velocity (OV) functions and time headway distributions are not necessarily qualitatively different, even if local congested traffic states are qualitatively different. The reason for this is that important spatiotemporal features of congested traffic patterns are lost in these as well as in many other macroscopic and microscopic traffic characteristics, which are widely used as the empirical basis for a test of traffic flow models, specifically, cellular automata traffic flow models

Response function and optimum configuration of semiconductor backscattered-electron detectors for scanning electron microscopes

International Nuclear Information System (INIS)

Rau, E. I.; Orlikovskiy, N. A.; Ivanova, E. S.

2012-01-01

A new highly efficient design for semiconductor detectors of intermediate-energy electrons (1–50 keV) for application in scanning electron microscopes is proposed. Calculations of the response function of advanced detectors and control experiments show that the efficiency of the developed devices increases on average twofold, which is a significant positive factor in the operation of modern electron microscopes in the mode of low currents and at low primary electron energies.

Zernike Phase Contrast Electron Cryo-Tomography Applied to Marine Cyanobacteria Infected with Cyanophages

Science.gov (United States)

Dai, Wei; Fu, Caroline; Khant, Htet A.; Ludtke, Steven J.; Schmid, Michael F.; Chiu, Wah

2015-01-01

Advances in electron cryo-tomography have provided a new opportunity to visualize the internal 3D structures of a bacterium. An electron microscope equipped with Zernike phase contrast optics produces images with dramatically increased contrast compared to images obtained by conventional electron microscopy. Here we describe a protocol to apply Zernike phase plate technology for acquiring electron tomographic tilt series of cyanophage-infected cyanobacterial cells embedded in ice, without staining or chemical fixation. We detail the procedures for aligning and assessing phase plates for data collection, and methods to obtain 3D structures of cyanophage assembly intermediates in the host, by subtomogram alignment, classification and averaging. Acquiring three to four tomographic tilt series takes approximately 12 h on a JEM2200FS electron microscope. We expect this time requirement to decrease substantially as the technique matures. Time required for annotation and subtomogram averaging varies widely depending on the project goals and data volume. PMID:25321408

Digital management of an electron microscope unit

International Nuclear Information System (INIS)

Elea, N.; Dickson, M.; Munroe, P.

2002-01-01

Full text: Electron microscope units, especially those such as ours, which operate as a central infrastructural facility are increasingly asked to provide more service, over more instruments with decreasing, or limited, financial resources. We believe that staff time is best used performing electron microscopy, assisting users and maintaining instrumentation rather than in the pursuit of red tape. One solution to this problem has been the creation of a control system which performs all routine acts of data management, such as the archiving and accessing of digital data, providing access to bookings, and most importantly in the era of user pays services, logging time and billing users. The system we have created, developed and expanded allows the users themselves to access our server through any web-browser and make their own bookings or access and manipulate their data. Users themselves must log on to a microscope through swipecard readers before it can be used and log-off after use. Their time is logged precisely and an exquisitely fair user pays systems can be operated by transferring logged usage time to spreadsheets to calculate charges. Furthermore, this system acts as a method of user authentication and can be used to bar incompetent or unauthorised users. The system has recently been upgraded to increase its utility to include sensors that monitor the electron microscope operating environment, such as magnetic field, room temperature, water flow etc, so that if these parameters depart significantly from optimum levels electron microscope unit staff may be alerted. In this presentation the structure of our system will be described and the advantages and disadvantages of such a system will be discussed. Copyright (2002) Australian Society for Electron Microscopy Inc

Energy dispersive X-ray analysis in the electron microscope

CERN Document Server

Bell, DC

2003-01-01

This book provides an in-depth description of x-ray microanalysis in the electron microscope. It is sufficiently detailed to ensure that novices will understand the nuances of high-quality EDX analysis. Includes information about hardware design as well as the physics of x-ray generation, absorption and detection, and most post-detection data processing. Details on electron optics and electron probe formation allow the novice to make sensible adjustments to the electron microscope in order to set up a system which optimises analysis. It also helps the reader determine which microanalytical me

Electron sputtering in the analytical electron microscope: Calculations and experimental data

International Nuclear Information System (INIS)

Zaluzec, N.J.; Mansfield, J.F.

1987-03-01

The environment of the electron microscope is particularly severe when one considers the energy deposited in a specimen during typical experimental conditions. Conventional imaging experiments tend to employ electron current densities ranging from ∼0.1 to 1 A/cm 2 while during microanalysis conditions probe current densities can range from 10 to values as high as 10 5 A/cm 2 . At 100 kV this corresponds to power densities from 100 Kilowatts/cm 2 to 10 4 Megawatts/cm 2 . These energy deposition rates can result in electron irradiation damage which can substantially alter the structure and composition of a specimen through either ionization damage in organics or by displacement damage in inorganics and/or combinations thereof. For the most part materials scientists operating an analytical electron microscope (AEM) in the 100 to 200 kV regime studying metallic and/or ceramic specimens have been spared the need to consider either of these effects as their specimens have tended to be sufficiently resilient. However, the advent of the new medium voltage microscopes operating in the 300 to 400 kV regime with high brightness guns and clean or ultrahigh vacuum systems has necessitated a reevaluation of the effects of higher voltage operation in light of the destructive nature of the electron beam particularly under microanalysis conditions

Sensitivity Analysis of X-ray Spectra from Scanning Electron Microscopes

Energy Technology Data Exchange (ETDEWEB)

Miller, Thomas Martin [Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Patton, Bruce W. [Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Weber, Charles F. [Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Bekar, Kursat B. [Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

2014-10-01

The primary goal of this project is to evaluate x-ray spectra generated within a scanning electron microscope (SEM) to determine elemental composition of small samples. This will be accomplished by performing Monte Carlo simulations of the electron and photon interactions in the sample and in the x-ray detector. The elemental inventories will be determined by an inverse process that progressively reduces the difference between the measured and simulated x-ray spectra by iteratively adjusting composition and geometric variables in the computational model. The intended benefit of this work will be to develop a method to perform quantitative analysis on substandard samples (heterogeneous phases, rough surfaces, small sizes, etc.) without involving standard elemental samples or empirical matrix corrections (i.e., true standardless quantitative analysis).

Transmission Electron Microscope Measures Lattice Parameters

Science.gov (United States)

Pike, William T.

1996-01-01

Convergent-beam microdiffraction (CBM) in thermionic-emission transmission electron microscope (TEM) is technique for measuring lattice parameters of nanometer-sized specimens of crystalline materials. Lattice parameters determined by use of CBM accurate to within few parts in thousand. Technique developed especially for use in quantifying lattice parameters, and thus strains, in epitaxial mismatched-crystal-lattice multilayer structures in multiple-quantum-well and other advanced semiconductor electronic devices. Ability to determine strains in indivdual layers contributes to understanding of novel electronic behaviors of devices.

Development of superconducting cryo-electron microscope and its applications

International Nuclear Information System (INIS)

Iwatsuki, Masashi

1988-01-01

Recently, a superconducting cryo-electron microscope in which specimens are cooled to the liquid helium temperature (4.2 K) has been developed. The main components and functional features of this new microscope are reported together with application data on polyethylene, poly (4-methyl-1-pentene), valonia cellulose, rock salt, ice crystallites and ceramic superconductor. The resistance to electron radiation damage, of beam-sensitive specimens including polymers has been increased more than ten times. Thus, the microscope has made it possible to take high resolution images and to analyze the crystal-structure of micro-areas. (orig.) [de

Development of the Atomic-Resolution Environmental Transmission Electron Microscope

DEFF Research Database (Denmark)

Gai, Pratibha L.; Boyes, Edward D.; Yoshida, Kenta

2016-01-01

The development of the novel atomic-resolution environmental transmission electron microscope (atomic-resolution ETEM) for directly probing dynamic gas–solid reactions in situ at the atomic level under controlled reaction conditions consisting of gas environment and elevated temperatures is descr......The development of the novel atomic-resolution environmental transmission electron microscope (atomic-resolution ETEM) for directly probing dynamic gas–solid reactions in situ at the atomic level under controlled reaction conditions consisting of gas environment and elevated temperatures...... is used to study steels, graphene, nanowires, etc. In this chapter, the experimental setup of the microscope column and its peripherals are described....

Transmission electron microscope studies of crystalline LiNbO3

International Nuclear Information System (INIS)

Pareja, R.; Gonzalez, R.; Chen, Y.

1984-01-01

Transmission electron microscope investigations in both as-grown and hydrogen-reduced LiNbO 3 reveal that niobium oxide precipitates can be produced by in situ irradiations in the electron microscope. The precipitation process is produced by a combined effect of ionizing electrons and the thermal heating of the specimens during irradiation. It is proposed that the composition of the precipitates is primarily Nb 2 O 5

Microscopic Mechanism of Doping-Induced Kinetically Constrained Crystallization in Phase-Change Materials.

Science.gov (United States)

Lee, Tae Hoon; Loke, Desmond; Elliott, Stephen R

2015-10-07

A comprehensive microscopic mechanism of doping-induced kinetically constrained crystallization in phase-change materials is provided by investigating structural and dynamical dopant characteristics via ab initio molecular dynamics simulations. The information gained from this study may provide a basis for a fast screening of dopant species for electronic memory devices, or for understanding the general physics involved in the crystallization of doped glasses. © 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Electron microscopic radioautography of the cell

International Nuclear Information System (INIS)

Sarkisov, D.S.; Pal'tsyn, A.A.; Vtyurin, B.V.

1980-01-01

This monograph is the first one in the world literature that gives th generalised experience in application of the up-to-date method of structural and functional analysis, i.e. of electron-microscopic autography to study the dynamics of intracellular processes under normal conditions as well as under some pathogenic effects. Given herein are the data on synthesis of DNA and RNA in various structures of the nucleus, particularly in nucleoli, the regularities of the synthesis processes in the organellae of the same name are discussed; illustrated are the possibilities of structure analysis of biosynthesis intensity variations in the nucleus and cytoplasma in cells of liver miocardium, granulation tissue at different stages of morphological process; the results of electron-microscopic radioautography application in study of clinical biopsy material are given and the data obtained are discussed in the light of general pathology problems

The reactions of loaded carbon nanotubes, studied by novel electron microscope techniques

International Nuclear Information System (INIS)

Rawcliffe, A.

1999-01-01

A novel electron microscope technique, controlled environment transmission electron microscopy (CETEM), has been used to investigate the reaction of materials loaded within the internal cavities of carbon nanotubes. CETEM allows the introduction of up to 20 mbar of gas around an electron microscope sample, while maintaining a high resolution imaging capability. The microscope is stable, flexible and reliable under these conditions and high resolution images of encapsulated transmission metal oxide reduction have been recorded at 460 deg. C. Recently discovered carbon nanotubes have in theory many applications, many of which will require controlled reliable loading of the internal cavity. However, at present, there is little experimental evidence to confirm theoretical descriptions of the fundamental mechanisms which govern both the extent of loading and the state in which it is found. Similarly, reaction within the cavity and the effect of encapsulation on the nano-scale particle distribution must also be understood, and CETEM proves to be an ideal technique for the study of these processes. Nanotubes have been loaded from aqueous solution with (NH 4 ) 2 IrCI 6 and with molten MoO 3 or K 2 WO 4 /WO 3 . Bulk samples of the first salt are known to decompose spontaneously in air at 200 deg. C, and the bulk oxides are partially reduced at temperature under hydrogen to give potentially useful conducting phases. Comparing the reaction of these materials it is thus possible to: investigate the effect of loading on their reaction; compare the reaction of these materials in- and out-side the tube cavity; and assess the result of violent loading processes on the tubes themselves. Fortuitously, a spontaneous decomposition, a solid-gas reduction and a phase rearrangement were all recorded, allowing mechanistic implications of encapsulation to be considered for each of these reactions. Perhaps surprisingly, the results can be largely interpreted using the reported bulk

High-resolution, high-throughput imaging with a multibeam scanning electron microscope.

Science.gov (United States)

Eberle, A L; Mikula, S; Schalek, R; Lichtman, J; Knothe Tate, M L; Zeidler, D

2015-08-01

Electron-electron interactions and detector bandwidth limit the maximal imaging speed of single-beam scanning electron microscopes. We use multiple electron beams in a single column and detect secondary electrons in parallel to increase the imaging speed by close to two orders of magnitude and demonstrate imaging for a variety of samples ranging from biological brain tissue to semiconductor wafers. © 2015 The Authors Journal of Microscopy © 2015 Royal Microscopical Society.

Exploring the environmental transmission electron microscope

DEFF Research Database (Denmark)

Wagner, Jakob B.; Cavalca, Filippo; Damsgaard, Christian D.

2012-01-01

of the opportunities that the environmental TEM (ETEM) offers when combined with other in situ techniques will be explored, directly in the microscope, by combining electron-based and photon-based techniques and phenomena. In addition, application of adjacent setups using sophisticated transfer methods...

Light, electron microscopic and immunohistochemical study of the effect of low-dose aspirin during the proestrus phase on rat endometrium in the preimplantation period.

Science.gov (United States)

Ateş, Utku; Baka, Meral; Turgut, Mehmet; Uyanikgil, Yiğit; Ulker, Sibel; Yilmaz, Ozlem; Tavmergen, Erol; Yurtseven, Mine

2007-04-01

To evaluate structural alterations in rat endometrium at preimplantation following treatment with aspirin beginning from proestrus by light microscopy, electron microscopy and immunohistochemical techniques. Twenty rats were divided into control (n = 10) and experimental (n = 10) groups. Experimental rats were treated with low-dose aspirin daily (2 mg/kg/day) during estrus, beginning from the proestrus phase, mated at end of cycle and treated with aspirin. Untreated pregnant rats were the control group. Rats in both groups were sacrificed at the 84th pregnancy hour; the uterus was rapidly removed and dissected free of surrounding adipose tissue. Uteri specimens from nonpregnant rats were transferred into fixative solution and processed for light, electron microscopic and immunohistochemical study. Light and electron microscopy of endometrium from control rats conformed to mid-diestrus phase; endometrial histology of the aspirin-treated group conformed to late diestrus phase. The endometrial layer was significantly thicker in the aspirin-treated group compared to the untreated control group (p <0.001). No significant difference was found in vessel number between groups. Staining with alphaV integrin was more dense in the aspirin-treated group. Based on histologic findings, we suggest low-dose aspirin has positive effects on preparing endometrium before implantation.

Large area fabrication of plasmonic nanoparticle grating structure by conventional scanning electron microscope

International Nuclear Information System (INIS)

Sudheer,; Tiwari, P.; Rai, V. N.; Srivastava, A. K.; Mukharjee, C.

2015-01-01

Plasmonic nanoparticle grating (PNG) structure of different periods has been fabricated by electron beam lithography using silver halide based transmission electron microscope film as a substrate. Conventional scanning electron microscope is used as a fabrication tool for electron beam lithography. Optical microscope and energy dispersive spectroscopy (EDS) have been used for its morphological and elemental characterization. Optical characterization is performed by UV-Vis absorption spectroscopic technique

Progress in x-ray microanalysis in the analytical electron microscope

International Nuclear Information System (INIS)

Williams, D.B.

1987-01-01

Analytical electron microscopes (AEM) consisting of x-ray energy dispersive spectrometers (EDS) interfaced to scanning transmission electron microscopes have been available for more than a decade. During that time, progress towards reaching the fundamental limits of the technique has been slow. The progress of x-ray microanalysis in AEM is examined in terms of x-ray detector technology; the EDS/AEM interface; accuracy of microanalysis; and spatial resolution and detectability limits. X-ray microanalysis in the AEM has substantial room for improvement in terms of the interface between the detector and the microscope. Advances in microscope design and software should permit 10nm resolution with detectability limits approaching 0.01wt percent. 16 refs., 2 figs., 1 tab

Reconstruction of an Non-Monochromatically Illuminated Object Imaged through an Electron Microscope with a Fluctuating Electromagnetic Field

NARCIS (Netherlands)

Hoenders, B.J.

1975-01-01

It is shown that a weak phase object imaged by an electron microscope within the presence of instabilities of the lense currents and the acceleration voltage, fluctuating electromagnetic field, can be reconstructed from the intensity distribution in the image plane. Perfectly incoherent illumination

Portable spectroscopic scanning electron microscope on ISS: in situ nanostructural/chemical analysis for critical vehicle systems, Phase I

Data.gov (United States)

National Aeronautics and Space Administration — We will construct a novel field-portable miniature analytical electron microscope (EM+EDS) called Mochii "S" for in situ sensing in harsh/remote environments such as...

Electron-microscopic autoradiography of tritiated testosterone in rat testis

International Nuclear Information System (INIS)

Frederik, P.M.; Molen, H.J. van der; Galjaard, H.; Klepper, D.

1977-01-01

The feasibility of a technique for autoradiography of diffusible substances has been further tested by analysing the localization of steroids in rats testes with the light- and electron-microscope. Testes of rats were perfused with tritiated testosterone (3 min) followed by 15-min perfusion with buffer containing a 100-fold excess of unlabelled testosterone. Tissue samples were frozen, freeze dried, fixed in osmium vapour and embedded in Epon. To exclude extraction of steroids, contact with water and other solvents was prevented during cutting of thin sections on an ultracryotome and further treatment for autoradiography. Light- and electron-microscopic observations indicated that the highest concentration of labelled testosterone was present within the basal parts of the Sertoli cell cytoplasm and in lipid inclusions of Sertoli cells within the seminiferous tubules. This is the first account of autoradiography of steroids at the electron-microscope level. (author)

Characterization of electron microscopes with binary pseudo-random multilayer test samples

Science.gov (United States)

Yashchuk, Valeriy V.; Conley, Raymond; Anderson, Erik H.; Barber, Samuel K.; Bouet, Nathalie; McKinney, Wayne R.; Takacs, Peter Z.; Voronov, Dmitriy L.

2011-09-01

Verification of the reliability of metrology data from high quality X-ray optics requires that adequate methods for test and calibration of the instruments be developed. For such verification for optical surface profilometers in the spatial frequency domain, a modulation transfer function (MTF) calibration method based on binary pseudo-random (BPR) gratings and arrays has been suggested [1,2] and proven to be an effective calibration method for a number of interferometric microscopes, a phase shifting Fizeau interferometer, and a scatterometer [5]. Here we describe the details of development of binary pseudo-random multilayer (BPRML) test samples suitable for characterization of scanning (SEM) and transmission (TEM) electron microscopes. We discuss the results of TEM measurements with the BPRML test samples fabricated from a WiSi 2/Si multilayer coating with pseudo-randomly distributed layers. In particular, we demonstrate that significant information about the metrological reliability of the TEM measurements can be extracted even when the fundamental frequency of the BPRML sample is smaller than the Nyquist frequency of the measurements. The measurements demonstrate a number of problems related to the interpretation of the SEM and TEM data. Note that similar BPRML test samples can be used to characterize X-ray microscopes. Corresponding work with X-ray microscopes is in progress.

Characterization of electron microscopes with binary pseudo-random multilayer test samples

International Nuclear Information System (INIS)

Yashchuk, Valeriy V.; Conley, Raymond; Anderson, Erik H.; Barber, Samuel K.; Bouet, Nathalie; McKinney, Wayne R.; Takacs, Peter Z.; Voronov, Dmitriy L.

2011-01-01

Verification of the reliability of metrology data from high quality X-ray optics requires that adequate methods for test and calibration of the instruments be developed. For such verification for optical surface profilometers in the spatial frequency domain, a modulation transfer function (MTF) calibration method based on binary pseudo-random (BPR) gratings and arrays has been suggested and proven to be an effective calibration method for a number of interferometric microscopes, a phase shifting Fizeau interferometer, and a scatterometer [5]. Here we describe the details of development of binary pseudo-random multilayer (BPRML) test samples suitable for characterization of scanning (SEM) and transmission (TEM) electron microscopes. We discuss the results of TEM measurements with the BPRML test samples fabricated from a WiSi 2 /Si multilayer coating with pseudo-randomly distributed layers. In particular, we demonstrate that significant information about the metrological reliability of the TEM measurements can be extracted even when the fundamental frequency of the BPRML sample is smaller than the Nyquist frequency of the measurements. The measurements demonstrate a number of problems related to the interpretation of the SEM and TEM data. Note that similar BPRML test samples can be used to characterize X-ray microscopes. Corresponding work with X-ray microscopes is in progress.

Isotope analysis in the transmission electron microscope.

Science.gov (United States)

Susi, Toma; Hofer, Christoph; Argentero, Giacomo; Leuthner, Gregor T; Pennycook, Timothy J; Mangler, Clemens; Meyer, Jannik C; Kotakoski, Jani

2016-10-10

The Ångström-sized probe of the scanning transmission electron microscope can visualize and collect spectra from single atoms. This can unambiguously resolve the chemical structure of materials, but not their isotopic composition. Here we differentiate between two isotopes of the same element by quantifying how likely the energetic imaging electrons are to eject atoms. First, we measure the displacement probability in graphene grown from either 12 C or 13 C and describe the process using a quantum mechanical model of lattice vibrations coupled with density functional theory simulations. We then test our spatial resolution in a mixed sample by ejecting individual atoms from nanoscale areas spanning an interface region that is far from atomically sharp, mapping the isotope concentration with a precision better than 20%. Although we use a scanning instrument, our method may be applicable to any atomic resolution transmission electron microscope and to other low-dimensional materials.

Historical evolution toward achieving ultrahigh vacuum in JEOL electron microscopes

CERN Document Server

Yoshimura, Nagamitsu

2014-01-01

This book describes the developmental history of the vacuum system of the transmission electron microscope (TEM) at the Japan Electron Optics Laboratory (JEOL) from its inception to its use in today’s high-technology microscopes. The author and his colleagues were engaged in developing vacuum technology for electron microscopes (JEM series) at JEOL for many years. This volume presents a summary and explanation of their work and the technology that makes possible a clean ultrahigh vacuum. The typical users of the TEM are top-level researchers working at the frontiers of new materials or with new biological specimens. They often use the TEM under extremely severe conditions, with problems sometimes occurring in the vacuum system of the microscopes. JEOL engineers then must work as quickly as possible to improve the vacuum evacuation system so as to prevent the recurrence of such problems. Among the wealth of explanatory material in this book are examples of users’ reports of problems in the vacuum system of...

Quantitative methods for the analysis of electron microscope images

DEFF Research Database (Denmark)

Skands, Peter Ulrik Vallø

1996-01-01

The topic of this thesis is an general introduction to quantitative methods for the analysis of digital microscope images. The images presented are primarily been acquired from Scanning Electron Microscopes (SEM) and interfermeter microscopes (IFM). The topic is approached though several examples...... foundation of the thesis fall in the areas of: 1) Mathematical Morphology; 2) Distance transforms and applications; and 3) Fractal geometry. Image analysis opens in general the possibility of a quantitative and statistical well founded measurement of digital microscope images. Herein lies also the conditions...

Charging of carbon thin films in scanning and phase-plate transmission electron microscopy

DEFF Research Database (Denmark)

Hettler, Simon; Kano, Emi; Dries, Manuel

2018-01-01

A systematic study on charging of carbon thin films under intense electron-beam irradiation was performed in a transmission electron microscope to identify the underlying physics for the functionality of hole-free phase plates. Thin amorphous carbon films fabricated by different deposition techni...

APPLICATION OF SCANNING ELECTRON MICROSCOPE EQUIPPED WITH THE MICROANALYSIS SYSTEM FOR INVESTIGATION OF BRASS COVERING

Directory of Open Access Journals (Sweden)

T. P. Kurenkova

2010-01-01

Full Text Available The possibilities of application of scanning electronic microscope equipped with microanalysis system for investigation of the brass covering quality by slug for production of wire and metal cord particularly of change of copper concentration by covering thickness and slug perimeter, revealing of ?-phase allocation presence and character, determination of defect reasons, are shown.

The Titan Environmental Transmission Electron Microscope

DEFF Research Database (Denmark)

Hansen, Thomas Willum; Wagner, Jakob Birkedal; Jinschek, Jörg R.

2009-01-01

University of Denmark (DTU) provides a unique combination of techniques for studying materials of interest to the catalytic as well as the electronics and other communities [5]. DTU’s ETEM is based on the FEI Titan platform providing ultrahigh microscope stability pushing the imaging resolution into the sub...

Electron beam dynamics in an ultrafast transmission electron microscope with Wehnelt electrode.

Science.gov (United States)

Bücker, K; Picher, M; Crégut, O; LaGrange, T; Reed, B W; Park, S T; Masiel, D J; Banhart, F

2016-12-01

High temporal resolution transmission electron microscopy techniques have shown significant progress in recent years. Using photoelectron pulses induced by ultrashort laser pulses on the cathode, these methods can probe ultrafast materials processes and have revealed numerous dynamic phenomena at the nanoscale. Most recently, the technique has been implemented in standard thermionic electron microscopes that provide a flexible platform for studying material's dynamics over a wide range of spatial and temporal scales. In this study, the electron pulses in such an ultrafast transmission electron microscope are characterized in detail. The microscope is based on a thermionic gun with a Wehnelt electrode and is operated in a stroboscopic photoelectron mode. It is shown that the Wehnelt bias has a decisive influence on the temporal and energy spread of the picosecond electron pulses. Depending on the shape of the cathode and the cathode-Wehnelt distance, different emission patterns with different pulse parameters are obtained. The energy spread of the pulses is determined by space charge and Boersch effects, given by the number of electrons in a pulse. However, filtering effects due to the chromatic aberrations of the Wehnelt electrode allow the extraction of pulses with narrow energy spreads. The temporal spread is governed by electron trajectories of different length and in different electrostatic potentials. High temporal resolution is obtained by excluding shank emission from the cathode and aberration-induced halos in the emission pattern. By varying the cathode-Wehnelt gap, the Wehnelt bias, and the number of photoelectrons in a pulse, tradeoffs between energy and temporal resolution as well as beam intensity can be made as needed for experiments. Based on the characterization of the electron pulses, the optimal conditions for the operation of ultrafast TEMs with thermionic gun assembly are elaborated. Copyright © 2016 Elsevier B.V. All rights reserved.

Transmission electron microscope studies of extraterrestrial materials

Science.gov (United States)

Keller, Lindsay P.

1995-01-01

Transmission Electron Microscopy, X-Ray spectrometry and electron-energy-loss spectroscopy are used to analyse carbon in interplanetary dust particles. Optical micrographs are shown depicting cross sections of the dust particles embedded in sulphur. Selected-area electron diffraction patterns are shown. Transmission Electron Microscope specimens of lunar soil were prepared using two methods: ion-milling and ultramicrotomy. A combination of high resolution TEM imaging and electron diffraction is used to characterize the opaque assemblages. The opaque assemblages analyzed in this study are dominated by ilmenite with lesser rutile and spinel exsolutions, and traces of Fe metal.

In situ observation of electron beam-induced phase transformation of CaCO3 to CaO via ELNES at low electron beam energies.

Science.gov (United States)

Golla-Schindler, Ute; Benner, Gerd; Orchowski, Alexander; Kaiser, Ute

2014-06-01

It is demonstrated that energy-filtered transmission electron microscope enables following of in situ changes of the Ca-L2,3 edge which can originate from variations in both local symmetry and bond lengths. Low accelerating voltages of 20 and 40 kV slow down radiation damage effects and enable study of the start and finish of phase transformations. We observed electron beam-induced phase transformation of single crystalline calcite (CaCO3) to polycrystalline calcium oxide (CaO) which occurs in different stages. The coordination of Ca in calcite is close to an octahedral one streched along the direction. Changes during phase transformation to an octahedral coordination of Ca in CaO go along with a bond length increase by 5 pm, where oxygen is preserved as a binding partner. Electron loss near-edge structure of the Ca-L2,3 edge show four separated peaks, which all shift toward lower energies during phase transformation at the same time the energy level splitting increases. We suggest that these changes can be mainly addressed to the change of the bond length on the order of picometers. An important pre-condition for such studies is stability of the energy drift in the range of meV over at least 1 h, which is achieved with the sub-Ångström low-voltage transmission electron microscope I prototype microscope.

Microstructure of steel X 20 Cr 13 in the electron microscopical picture

International Nuclear Information System (INIS)

Gesatzke, W.

1982-01-01

The tempered microstructure of the steel X 20 Cr 13 is described by an electron microscopical overall picture and additional information is gained which would not be possible with the optical microscope. The large transmission area permits one to quantitatively evaluate a microstructure component which due to its small size can only be measured with electron microscope pictures. (orig.) [de

Ultra low-K shrinkage behavior when under electron beam in a scanning electron microscope

Energy Technology Data Exchange (ETDEWEB)

Lorut, F.; Imbert, G. [ST Microelectronics, 850 rue Jean Monnet, 38926 Crolles Cedex (France); Roggero, A. [Centre National d' Etudes Spatiales, 18 Avenue Edouard Belin, 31400 Toulouse (France)

2013-08-28

In this paper, we investigate the tendency of porous low-K dielectrics (also named Ultra Low-K, ULK) behavior to shrink when exposed to the electron beam of a scanning electron microscope. Various experimental electron beam conditions have been used for irradiating ULK thin films, and the resulting shrinkage has been measured through use of an atomic force microscope tool. We report the shrinkage to be a fast, cumulative, and dose dependent effect. Correlation of the shrinkage with incident electron beam energy loss has also been evidenced. The chemical modification of the ULK films within the interaction volume has been demonstrated, with a densification of the layer and a loss of carbon and hydrogen elements being observed.

Microscope and method of use

Science.gov (United States)

Bongianni, Wayne L.

1984-01-01

A method and apparatus for electronically focusing and electronically scanning microscopic specimens are given. In the invention, visual images of even moving, living, opaque specimens can be acoustically obtained and viewed with virtually no time needed for processing (i.e., real time processing is used). And planar samples are not required. The specimens (if planar) need not be moved during scanning, although it will be desirable and possible to move or rotate nonplanar specimens (e.g., laser fusion targets) against the lens of the apparatus. No coupling fluid is needed, so specimens need not be wetted. A phase acoustic microscope is also made from the basic microscope components together with electronic mixers.

Acquisition parameters optimization of a transmission electron forward scatter diffraction system in a cold-field emission scanning electron microscope for nanomaterials characterization.

Science.gov (United States)

Brodusch, Nicolas; Demers, Hendrix; Trudeau, Michel; Gauvin, Raynald

2013-01-01

Transmission electron forward scatter diffraction (t-EFSD) is a new technique providing crystallographic information with high resolution on thin specimens by using a conventional electron backscatter diffraction (EBSD) system in a scanning electron microscope. In this study, the impact of tilt angle, working distance, and detector distance on the Kikuchi pattern quality were investigated in a cold-field emission scanning electron microscope (CFE-SEM). We demonstrated that t-EFSD is applicable for tilt angles ranging from -20° to -40°. Working distance (WD) should be optimized for each material by choosing the WD for which the EBSD camera screen illumination is the highest, as the number of detected electrons on the screen is directly dependent on the scattering angle. To take advantage of the best performances of the CFE-SEM, the EBSD camera should be close to the sample and oriented towards the bottom to increase forward scattered electron collection efficiency. However, specimen chamber cluttering and beam/mechanical drift are important limitations in the CFE-SEM used in this work. Finally, the importance of t-EFSD in materials science characterization was illustrated through three examples of phase identification and orientation mapping. © Wiley Periodicals, Inc.

Cooled CCDs for recording data from electron microscopes

CERN Document Server

Faruqi, A R

2000-01-01

A cooled-CCD camera based on a low-noise scientific grade device is described in this paper used for recording images in a 120 kV electron microscope. The primary use of the camera is for recording electron diffraction patterns from two-dimensionally ordered arrays of proteins at liquid-nitrogen temperatures leading to structure determination at atomic or near-atomic resolution. The traditional method for recording data in the microscope is with electron sensitive film but electronic detection methods offer the following advantages over film methods: the data is immediately available in a digital format which can be displayed on a monitor screen for visual inspection whereas a film record needs to be developed and digitised, a lengthy process taking at least several hours, prior to inspection; the dynamic range of CCD detectors is about two orders of magnitude greater with better linearity. The accuracy of measurements is also higher for CCDs, particularly for weak signals due to inherent fog levels in film. ...

Magnetic imaging with a Zernike-type phase plate in a transmission electron microscope

DEFF Research Database (Denmark)

Pollard, Shawn; Malac, Marek; Beleggia, Marco

2013-01-01

We demonstrate the use of a hole-free phase plate (HFPP) for magnetic imaging in transmission electron microscopy by mapping the domain structure in PrDyFeB samples. The HFPP, a Zernike-like imaging method, allows for detecting magnetic signals in-focus to correlate the sample crystal structure...... the reference wave distortion from long-range fields affecting electron holography....

Scanning electron microscope - some aspects of the instrument and its applications

International Nuclear Information System (INIS)

Thatte, M.R.

1976-01-01

Development of the science of microscopy leading to three different types of microscopes - the optical, the conventional transmission electron microscope (CTEM) and the scanning electron microscope(SEM) has been discussed. Special advantages of the SEM in the solution of problems in industrial laboratories are mentioned. A brief reference to the latest instruments announced by Siemens AG shows the modern trends in the technique. A close similarity in image building between SEM and television is indicated. Operational anatomy of the SEM is reviewed. (author)

Enhanced thermal stability of a polymer solar cell blend induced by electron beam irradiation in the transmission electron microscope

Energy Technology Data Exchange (ETDEWEB)

Bäcke, Olof, E-mail: obacke@chalmers.se [Department of Applied Physics, Chalmers University of Technology, 41296 Göteborg (Sweden); Lindqvist, Camilla; Diaz de Zerio Mendaza, Amaia [Department of Chemistry and Chemical Engineering, Chalmers University of Technology, 41296 Göteborg (Sweden); Gustafsson, Stefan [Department of Applied Physics, Chalmers University of Technology, 41296 Göteborg (Sweden); Wang, Ergang; Andersson, Mats R.; Müller, Christian [Department of Chemistry and Chemical Engineering, Chalmers University of Technology, 41296 Göteborg (Sweden); Kristiansen, Per Magnus [Institute of Polymer Nanotechnology (INKA), FHNW University of Applied Science and Arts Northwestern Switzerland, 5210 Windisch (Switzerland); Laboratory for Micro- and Nanotechnology, Paul Scherrer Institute, 5232 Villigen (Switzerland); Olsson, Eva, E-mail: eva.olsson@chalmers.se [Department of Applied Physics, Chalmers University of Technology, 41296 Göteborg (Sweden)

2017-05-15

We show by in situ microscopy that the effects of electron beam irradiation during transmission electron microscopy can be used to lock microstructural features and enhance the structural thermal stability of a nanostructured polymer:fullerene blend. Polymer:fullerene bulk-heterojunction thin films show great promise for use as active layers in organic solar cells but their low thermal stability is a hindrance. Lack of thermal stability complicates manufacturing and influences the lifetime of devices. To investigate how electron irradiation affects the thermal stability of polymer:fullerene films, a model bulk-heterojunction film based on a thiophene-quinoxaline copolymer and a fullerene derivative was heat-treated in-situ in a transmission electron microscope. In areas of the film that exposed to the electron beam the nanostructure of the film remained stable, while the nanostructure in areas not exposed to the electron beam underwent large phase separation and nucleation of fullerene crystals. UV–vis spectroscopy shows that the polymer:fullerene films are stable for electron doses up to 2000 kGy. - Highlights: • Thermal stability of a polymer: fullerne blend is increased using electron irradiation. • Using in-situ transmission electron microscopy the nanostructure is studied. • Electron irradiation stops phase separation between the polymer and fullerene. • Electron irradiation quenches the formation and nucleation of fullerene crystals.

Transmission environmental scanning electron microscope with scintillation gaseous detection device

International Nuclear Information System (INIS)

Danilatos, Gerasimos; Kollia, Mary; Dracopoulos, Vassileios

2015-01-01

A transmission environmental scanning electron microscope with use of a scintillation gaseous detection device has been implemented. This corresponds to a transmission scanning electron microscope but with addition of a gaseous environment acting both as environmental and detection medium. A commercial type of low vacuum machine has been employed together with appropriate modifications to the detection configuration. This involves controlled screening of various emitted signals in conjunction with a scintillation gaseous detection device already provided with the machine for regular surface imaging. Dark field and bright field imaging has been obtained along with other detection conditions. With a progressive series of modifications and tests, the theory and practice of a novel type of microscopy is briefly shown now ushering further significant improvements and developments in electron microscopy as a whole. - Highlights: • Novel scanning transmission electron microscopy (STEM) with an environmental scanning electron microscope (ESEM) called TESEM. • Use of the gaseous detection device (GDD) in scintillation mode that allows high resolution bright and dark field imaging in the TESEM. • Novel approach towards a unification of both vacuum and environmental conditions in both bulk/surface and transmission mode of electron microscopy

Remote laboratory for phase-aided 3D microscopic imaging and metrology

Science.gov (United States)

Wang, Meng; Yin, Yongkai; Liu, Zeyi; He, Wenqi; Li, Boqun; Peng, Xiang

2014-05-01

In this paper, the establishment of a remote laboratory for phase-aided 3D microscopic imaging and metrology is presented. Proposed remote laboratory consists of three major components, including the network-based infrastructure for remote control and data management, the identity verification scheme for user authentication and management, and the local experimental system for phase-aided 3D microscopic imaging and metrology. The virtual network computer (VNC) is introduced to remotely control the 3D microscopic imaging system. Data storage and management are handled through the open source project eSciDoc. Considering the security of remote laboratory, the fingerprint is used for authentication with an optical joint transform correlation (JTC) system. The phase-aided fringe projection 3D microscope (FP-3DM), which can be remotely controlled, is employed to achieve the 3D imaging and metrology of micro objects.

Microscopic origin of black hole reentrant phase transitions

Science.gov (United States)

Zangeneh, M. Kord; Dehyadegari, A.; Sheykhi, A.; Mann, R. B.

2018-04-01

Understanding the microscopic behavior of the black hole ingredients has been one of the important challenges in black hole physics during the past decades. In order to shed some light on the microscopic structure of black holes, in this paper, we explore a recently observed phenomenon for black holes namely reentrant phase transition, by employing the Ruppeiner geometry. Interestingly enough, we observe two properties for the phase behavior of small black holes that leads to reentrant phase transition. They are correlated and they are of the interaction type. For the range of pressure in which the system underlies reentrant phase transition, it transits from the large black holes phase to the small one which possesses higher correlation than the other ranges of pressures. On the other hand, the type of interaction between small black holes near the large/small transition line differs for usual and reentrant phase transitions. Indeed, for the usual case, the dominant interaction is repulsive whereas for the reentrant case we encounter an attractive interaction. We show that in the reentrant phase transition case, the small black holes behave like a bosonic gas whereas in the usual phase transition case, they behave like a quantum anyon gas.

Simultaneous specimen and stage cleaning device for analytical electron microscope

Science.gov (United States)

Zaluzec, Nestor J.

1996-01-01

An improved method and apparatus are provided for cleaning both a specimen stage, a specimen and an interior of an analytical electron microscope (AEM). The apparatus for cleaning a specimen stage and specimen comprising a plasma chamber for containing a gas plasma and an air lock coupled to the plasma chamber for permitting passage of the specimen stage and specimen into the plasma chamber and maintaining an airtight chamber. The specimen stage and specimen are subjected to a reactive plasma gas that is either DC or RF excited. The apparatus can be mounted on the analytical electron microscope (AEM) for cleaning the interior of the microscope.

Microscopic modelling of doped manganites

International Nuclear Information System (INIS)

Weisse, Alexander; Fehske, Holger

2004-01-01

Colossal magneto-resistance manganites are characterized by a complex interplay of charge, spin, orbital and lattice degrees of freedom. Formulating microscopic models for these compounds aims at meeting two conflicting objectives: sufficient simplification without excessive restrictions on the phase space. We give a detailed introduction to the electronic structure of manganites and derive a microscopic model for their low-energy physics. Focusing on short-range electron-lattice and spin-orbital correlations we supplement the modelling with numerical simulations

Advances in imaging and electron physics the scanning transmission electron microscope

CERN Document Server

Hawkes, Peter W

2009-01-01

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.  This particular volume presents several timely articles on the scanning transmission electron microscope. Updated with contributions from leading international scholars and industry experts Discusses hot topic areas and presents current and future research trends Provides an invaluable reference and guide for physicists, engineers and mathematicians.

Scanning tunnel microscope with large vision field compatible with a scanning electron microscope

International Nuclear Information System (INIS)

Volodin, A.P.; Stepanyan, G.A.; Khajkin, M.S.; Ehdel'man, V.S.

1989-01-01

A scanning tunnel microscope (STM) with the 20μm vision field and 1nm resolution, designed to be compatible with a scanning electron microscope (SEM), is described. The sample scanning area is chosen within the 3x10mm limits with a 0.1-1μm step. The STM needle is moved automatically toward the sample surface from the maximum distance of 10mm until the tunneling current appears. Bimorphous elements of the KP-1 piezocorrector are used in the STM design. The device is installed on a table of SEM object holders

Specimen holder for an electron microscope and device and method for mounting a specimen in an electron microscope

NARCIS (Netherlands)

Zandbergen, H.W.; Latenstein van Voorst, A.; Westra, C.; Hoveling, G.H.

1996-01-01

A specimen holder for an electron microscope, comprising a bar-shaped body provided adjacent one end with means for receiving a specimen, with means being present for screening the specimen from the environment at least temporarily in airtight and moisture-proof manner in a first position, which

Electron beam dynamics in an ultrafast transmission electron microscope with Wehnelt electrode

Energy Technology Data Exchange (ETDEWEB)

Bücker, K.; Picher, M.; Crégut, O. [Institut de Physique et Chimie des Matériaux de Strasbourg, UMR 7504 CNRS, Université de Strasbourg, 23 rue du Loess, 67034 Strasbourg (France); LaGrange, T. [Interdisciplinary Centre for Electron Microscopy, École Polytechnique Fédérale de Lausanne, 1015 Lausanne (Switzerland); Reed, B.W.; Park, S.T.; Masiel, D.J. [Integrated Dynamic Electron Solutions, Inc., 5653 Stoneridge Drive 117, Pleasanton, CA 94588 (United States); Banhart, F., E-mail: florian.banhart@ipcms.unistra.fr [Institut de Physique et Chimie des Matériaux de Strasbourg, UMR 7504 CNRS, Université de Strasbourg, 23 rue du Loess, 67034 Strasbourg (France)

2016-12-15

High temporal resolution transmission electron microscopy techniques have shown significant progress in recent years. Using photoelectron pulses induced by ultrashort laser pulses on the cathode, these methods can probe ultrafast materials processes and have revealed numerous dynamic phenomena at the nanoscale. Most recently, the technique has been implemented in standard thermionic electron microscopes that provide a flexible platform for studying material's dynamics over a wide range of spatial and temporal scales. In this study, the electron pulses in such an ultrafast transmission electron microscope are characterized in detail. The microscope is based on a thermionic gun with a Wehnelt electrode and is operated in a stroboscopic photoelectron mode. It is shown that the Wehnelt bias has a decisive influence on the temporal and energy spread of the picosecond electron pulses. Depending on the shape of the cathode and the cathode-Wehnelt distance, different emission patterns with different pulse parameters are obtained. The energy spread of the pulses is determined by space charge and Boersch effects, given by the number of electrons in a pulse. However, filtering effects due to the chromatic aberrations of the Wehnelt electrode allow the extraction of pulses with narrow energy spreads. The temporal spread is governed by electron trajectories of different length and in different electrostatic potentials. High temporal resolution is obtained by excluding shank emission from the cathode and aberration-induced halos in the emission pattern. By varying the cathode-Wehnelt gap, the Wehnelt bias, and the number of photoelectrons in a pulse, tradeoffs between energy and temporal resolution as well as beam intensity can be made as needed for experiments. Based on the characterization of the electron pulses, the optimal conditions for the operation of ultrafast TEMs with thermionic gun assembly are elaborated. - Highlights: • A detailed characterization of electron

Towards native-state imaging in biological context in the electron microscope

Science.gov (United States)

Weston, Anne E.; Armer, Hannah E. J.

2009-01-01

Modern cell biology is reliant on light and fluorescence microscopy for analysis of cells, tissues and protein localisation. However, these powerful techniques are ultimately limited in resolution by the wavelength of light. Electron microscopes offer much greater resolution due to the shorter effective wavelength of electrons, allowing direct imaging of sub-cellular architecture. The harsh environment of the electron microscope chamber and the properties of the electron beam have led to complex chemical and mechanical preparation techniques, which distance biological samples from their native state and complicate data interpretation. Here we describe recent advances in sample preparation and instrumentation, which push the boundaries of high-resolution imaging. Cryopreparation, cryoelectron microscopy and environmental scanning electron microscopy strive to image samples in near native state. Advances in correlative microscopy and markers enable high-resolution localisation of proteins. Innovation in microscope design has pushed the boundaries of resolution to atomic scale, whilst automatic acquisition of high-resolution electron microscopy data through large volumes is finally able to place ultrastructure in biological context. PMID:19916039

Compact design of a transmission electron microscope-scanning tunneling microscope holder with three-dimensional coarse motion

International Nuclear Information System (INIS)

Svensson, K.; Jompol, Y.; Olin, H.; Olsson, E.

2003-01-01

A scanning tunneling microscope (STM) with a compact, three-dimensional, inertial slider design is presented. Inertial sliding of the STM tip, in three dimensions, enables coarse motion and scanning using only one piezoelectric tube. Using the same electronics both for scanning and inertial sliding, step lengths of less than 5% of the piezo range were achieved. The compact design, less than 1 cm3 in volume, ensures a low mechanical noise level and enables us to fit the STM into the sample holder of a transmission electron microscope (TEM), while maintaining atomic scale resolution in both STM and TEM imaging

Microscopic Electron Variations Measured Simultaneously By The Cluster Spacecraft

Science.gov (United States)

Buckley, A. M.; Carozzi, T. D.; Gough, M. P.; Beloff, N.

Data is used from the Particle Correlator experiments running on each of the four Cluster spacecraft so as to determine common microscopic behaviour in the elec- tron population observed over the macroscopic Cluster separations. The Cluster par- ticle correlator experiments operate by forming on board Auto Correlation Functions (ACFs) generated from short time series of electron counts obtained, as a function of electron energy, from the PEACE HEEA sensor. The information on the microscopic variation of the electron flux covers the frequency range DC up to 41 kHz (encom- passing typical electron plasma frequencies and electron gyro frequencies and their harmonics), the electron energy range is that covered by the PEACE HEEA sensor (within the range 1 eV to 26 keV). Results are presented of coherent electron struc- tures observed simultaneously by the four spacecraft in the differing plasma interac- tion regions and boundaries encountered by Cluster. As an aid to understanding the plasma interactions, use is made of numerical simulations which model both the un- derlying statistical properties of the electrons and also the manner in which particle correlator experiments operate.

Determination of the parameters of a microscopic object from a complex response of a differential microscope

International Nuclear Information System (INIS)

Baranov, D V; Egorov, Alexander A; Zolotov, Evgenii M; Svidzinsky, K K

1998-01-01

An analysis of the amplitude and phase of a complex response of a heterodyne differential microscope was used to demonstrate experimentally the feasibility of determination of the parameters of a composite microscopic object representing a combination of a step with a groove. (laser applications and other topics in quantum electronics)

Evidence of a fractional quantum Hall nematic phase in a microscopic model

Science.gov (United States)

Regnault, N.; Maciejko, J.; Kivelson, S. A.; Sondhi, S. L.

2017-07-01

At small momenta, the Girvin-MacDonald-Platzman (GMP) mode in the fractional quantum Hall (FQH) effect can be identified with gapped nematic fluctuations in the isotropic FQH liquid. This correspondence would be exact as the GMP mode softens upon approach to the putative point of a quantum phase transition to a FQH nematic. Motivated by these considerations as well as by suggestive evidence of an FQH nematic in tilted field experiments, we have sought evidence of such a nematic FQHE in a microscopic model of interacting electrons in the lowest Landau level at filling factor 1/3. Using a family of anisotropic Laughlin states as trial wave functions, we find a continuous quantum phase transition between the isotropic Laughlin liquid and the FQH nematic. Results of numerical exact diagonalization also suggest that rotational symmetry is spontaneously broken, and that the phase diagram of the model contains both a nematic and a stripe phase.

Electron spin resonance scanning tunneling microscope

International Nuclear Information System (INIS)

Guo Yang; Li Jianmei; Lu Xinghua

2015-01-01

It is highly expected that the future informatics will be based on the spins of individual electrons. The development of elementary information unit will eventually leads to novel single-molecule or single-atom devices based on electron spins; the quantum computer in the future can be constructed with single electron spins as the basic quantum bits. However, it is still a great challenge in detection and manipulation of a single electron spin, as well as its coherence and entanglement. As an ideal experimental tool for such tasks, the development of electron spin resonance scanning tunneling microscope (ESR-STM) has attracted great attention for decades. This paper briefly introduces the basic concept of ESR-STM. The development history of this instrument and recent progresses are reviewed. The underlying mechanism is explored and summarized. The challenges and possible solutions are discussed. Finally, the prospect of future direction and applications are presented. (authors)

Field electron emission spectrometer combined with field ion/electron microscope as a field emission laboratory

International Nuclear Information System (INIS)

Shkuratov, S.I.; Ivanov, S.N.; Shilimanov, S.N.

1996-01-01

The facility, combining the field ion microscope, field electron emission microscope and field electron emission spectrometer, is described. Combination of three methodologies makes it possible to carry out the complete cycle of emission studies. Atom-plane and clean surface of the studied samples is prepared by means of field evaporation of the material atom layers without any thermal and radiation impact. This enables the study of atom and electron structure of clean surface of the wide range materials, the study whereof through the field emission methods was previously rather difficult. The temperature of the samples under study changes from 75 up to 2500 K. The energy resolution of the electron analyzer equals 30 MeV. 19 refs., 10 figs

Oxidation mechanism of nickel particles studied in an environmental transmission electron microscope

DEFF Research Database (Denmark)

Jeangros, Q.; Hansen, Thomas Willum; Wagner, Jakob Birkedal

2014-01-01

The oxidation of nickel particles was studied in situ in an environmental transmission electron microscope in 3.2 mbar of O2 between ambient temperature and 600°C. Several different transmission electron microscopy imaging techniques, electron diffraction and electron energy-loss spectroscopy were...... diffusion of Ni2+ along NiO grain boundaries, self-diffusion of Ni2+ ions and vacancies, growth of NiO grains and nucleation of voids at Ni/NiO interfaces. We also observed the formation of transverse cracks in a growing NiO film in situ in the electron microscope....

Electron microscope autoradiography of isolated DNA molecules

International Nuclear Information System (INIS)

Delain, Etienne; Bouteille, Michel

1980-01-01

Autoradiographs of 3 H-thymidine-labelled DNA molecules were observed with an electron microscope. After ten months of exposure significant labelling was obtained with tritiated T7 DNA molecules which had a specific activity of 630,000 cpm/μg. Although isolated DNA molecules were not stretched out to such an extent that they could be rigorously compared to straight 'hot lines', the resolution was estimated and found to be similar to that obtained by autoradiography on thin plastic sections. The H.D. value was of the order of 1600A. From the known specific activity of the macromolecules, it was possible to compare the expected number of disintegrations from the samples to the number of grains obtained on the autoradiograms. This enabled us to calculate 1/ The absolute autoradiographic efficiency and 2/ The per cent ratio of thymidine residues labelled with tritium. These results throw some light on the resolution and sensitivity of electron microscope autoradiography of shadowed isolated macromolecules as compared to thin plastic sections

Scanning electron microscopic evaluation of root canal surfaces ...

African Journals Online (AJOL)

Scanning electron microscopic evaluation of root canal surfaces prepared with three rotary endodontic systems: Lightspeed, ProTaper and EndoWave. ... fracture with LightSpeed (LS), ProTaper (PT) and EndoWave (Ew) rotary instruments.

Hartmann characterization of the PEEM-3 aberration-corrected X-ray photoemission electron microscope.

Science.gov (United States)

Scholl, A; Marcus, M A; Doran, A; Nasiatka, J R; Young, A T; MacDowell, A A; Streubel, R; Kent, N; Feng, J; Wan, W; Padmore, H A

2018-05-01

Aberration correction by an electron mirror dramatically improves the spatial resolution and transmission of photoemission electron microscopes. We will review the performance of the recently installed aberration corrector of the X-ray Photoemission Electron Microscope PEEM-3 and show a large improvement in the efficiency of the electron optics. Hartmann testing is introduced as a quantitative method to measure the geometrical aberrations of a cathode lens electron microscope. We find that aberration correction leads to an order of magnitude reduction of the spherical aberrations, suggesting that a spatial resolution of below 100 nm is possible at 100% transmission of the optics when using x-rays. We demonstrate this improved performance by imaging test patterns employing element and magnetic contrast. Published by Elsevier B.V.

The influence of microscopic and macroscopic non-stoichiometry on interfacial planarity during the solid-phase epitaxial growth of amorphized GaAs

International Nuclear Information System (INIS)

Belay, K.B.; Ridgway, M.C.; Llewellyn, D.J.

1996-01-01

The influence of microscopic and macroscopic non-stoichiometry on the Solid-Phase Epitaxial Growth of GaAs has been studied. Ion implantation has been employed to produce microscopic non-stoichiometry via Ga and As implants and macroscopic non-stoichiometry via Ga or As implants. In-situ Time Resolved Reflectivity and Transmission Electron Microscopy and ex-situ Rutherford Backscattering Spectroscopy and Channeling have been used to investigate the regrowth of amorphized GaAs layers. As non-stoichiometry shifts from microscopic to macroscopic the interface loses its planar nature and subsequently gets rougher. 7 refs., 3 figs

The influence of microscopic and macroscopic non-stoichiometry on interfacial planarity during the solid-phase epitaxial growth of amorphized GaAs

Energy Technology Data Exchange (ETDEWEB)

Belay, K.B.; Ridgway, M.C.; Llewellyn, D.J. [Australian National Univ., Canberra, ACT (Australia). Dept. of Physics

1996-12-31

The influence of microscopic and macroscopic non-stoichiometry on the Solid-Phase Epitaxial Growth of GaAs has been studied. Ion implantation has been employed to produce microscopic non-stoichiometry via Ga and As implants and macroscopic non-stoichiometry via Ga or As implants. In-situ Time Resolved Reflectivity and Transmission Electron Microscopy and ex-situ Rutherford Backscattering Spectroscopy and Channeling have been used to investigate the regrowth of amorphized GaAs layers. As non-stoichiometry shifts from microscopic to macroscopic the interface loses its planar nature and subsequently gets rougher. 7 refs., 3 figs.

The influence of microscopic and macroscopic non-stoichiometry on interfacial planarity during the solid-phase epitaxial growth of amorphized GaAs

Energy Technology Data Exchange (ETDEWEB)

Belay, K B; Ridgway, M C; Llewellyn, D J [Australian National Univ., Canberra, ACT (Australia). Dept. of Physics

1997-12-31

The influence of microscopic and macroscopic non-stoichiometry on the Solid-Phase Epitaxial Growth of GaAs has been studied. Ion implantation has been employed to produce microscopic non-stoichiometry via Ga and As implants and macroscopic non-stoichiometry via Ga or As implants. In-situ Time Resolved Reflectivity and Transmission Electron Microscopy and ex-situ Rutherford Backscattering Spectroscopy and Channeling have been used to investigate the regrowth of amorphized GaAs layers. As non-stoichiometry shifts from microscopic to macroscopic the interface loses its planar nature and subsequently gets rougher. 7 refs., 3 figs.

X-ray analysis of a single aerosol particle with combination of scanning electron microscope and synchrotron radiation X-ray microscope

International Nuclear Information System (INIS)

Toyoda, Masatoshi; Kaibuchi, Kazuki; Nagasono, Mitsuru; Terada, Yasuko; Tanabe, Teruo; Hayakawa, Shinjiro; Kawai, Jun

2004-01-01

We developed a microscope by a combination of synchrotron radiation X-ray fluorescence (SR-XRF) microscope and scanning electron microscope (SEM) with an energy dispersive X-ray spectrometer (EDX). SR-XRF is appropriate to detect trace and micro amount of elements and sensitive to heavy elements in an analyte but it cannot observe the real time image. SEM-EDX can observe the secondary electron image of a single particle in real time and is appropriate to detect lighter elements. This combination microscope can ensure the identification of the XRF spectrum to the SEM image without transferring the sample. For aerosol analysis, it is important to analyze each particle. The present method makes feasible to analyze not only the average elemental composition as the total particles but also elemental composition of each particle, which is dependent on the particle shape and size. The microscope was applied to an individual aerosol particle study. The X-ray spectra were different among the particles, but also different between SR-XRF and SEM-EDX for the same particle, due to the difference in fluorescence yields between X-ray excitation and electron excitation

Enhanced thermal stability of a polymer solar cell blend induced by electron beam irradiation in the transmission electron microscope.

Science.gov (United States)

Bäcke, Olof; Lindqvist, Camilla; de Zerio Mendaza, Amaia Diaz; Gustafsson, Stefan; Wang, Ergang; Andersson, Mats R; Müller, Christian; Kristiansen, Per Magnus; Olsson, Eva

2017-05-01

We show by in situ microscopy that the effects of electron beam irradiation during transmission electron microscopy can be used to lock microstructural features and enhance the structural thermal stability of a nanostructured polymer:fullerene blend. Polymer:fullerene bulk-heterojunction thin films show great promise for use as active layers in organic solar cells but their low thermal stability is a hindrance. Lack of thermal stability complicates manufacturing and influences the lifetime of devices. To investigate how electron irradiation affects the thermal stability of polymer:fullerene films, a model bulk-heterojunction film based on a thiophene-quinoxaline copolymer and a fullerene derivative was heat-treated in-situ in a transmission electron microscope. In areas of the film that exposed to the electron beam the nanostructure of the film remained stable, while the nanostructure in areas not exposed to the electron beam underwent large phase separation and nucleation of fullerene crystals. UV-vis spectroscopy shows that the polymer:fullerene films are stable for electron doses up to 2000kGy. Copyright © 2016 Elsevier B.V. All rights reserved.

French contributions to electron microscopic radioautography

International Nuclear Information System (INIS)

Droz, B.

1994-01-01

The radio autographic contributions carried out by electron microscopists took a part to improve the methodology and to extend applications to major biological problems. As underlined by CP Leblonc radioautography has clarified the importance of renewing systems; one may truly say that radioautography has introduced the time dimension in histology. The sites of biosynthesis of different substances have been located on the sub cellar scale, and it is now possible to analyse the molecular migrations within cells. The development of in situ hybridization and of receptors binding sites at the ultrastructural level has enlarged the application field of electron microscope radioautography. 64 refs., 2 figs

Analytical electron microscope based on scanning transmission electron microscope with wavelength dispersive x-ray spectroscopy to realize highly sensitive elemental imaging especially for light elements

International Nuclear Information System (INIS)

Koguchi, Masanari; Tsuneta, Ruriko; Anan, Yoshihiro; Nakamae, Koji

2017-01-01

An analytical electron microscope based on the scanning transmission electron microscope with wavelength dispersive x-ray spectroscopy (STEM-WDX) to realize highly sensitive elemental imaging especially for light elements has been developed. In this study, a large-solid-angle multi-capillary x-rays lens with a focal length of 5 mm, long-time data acquisition (e.g. longer than 26 h), and a drift-free system made it possible to visualize boron-dopant images in a Si substrate at a detection limit of 0.2 atomic percent. (paper)

Simulation of electron displacement damage in a high voltage electron microscope

International Nuclear Information System (INIS)

Ono, Susumu; Kanaya, Koichi

1979-01-01

By applying the fundamental theory of the neutron cooling to the conservation law of energy and momentum, the threshold energies of incident electrons for displacing atoms are calculated and illustrated periodically for the atomic number. And the observable damage due to the secondary action of displaced atoms in the practical use of a high voltage electron microscope is described for several materials and accelerating voltages. The trajectories of incident electrons and displaced atoms in several materials are simulated by a Monte-Carlo method, using rigorous formulas of electron scattering events, i.e. elastic and inelastic scattering cross-sections, ionization loss and plasmon excitation. The simulation results are substantially agreement with experiments. (author)

Nanoscale Energy-Filtered Scanning Confocal Electron Microscopy Using a Double-Aberration-Corrected Transmission Electron Microscope

International Nuclear Information System (INIS)

Wang Peng; Behan, Gavin; Kirkland, Angus I.; Nellist, Peter D.; Takeguchi, Masaki; Hashimoto, Ayako; Mitsuishi, Kazutaka; Shimojo, Masayuki

2010-01-01

We demonstrate that a transmission electron microscope fitted with two spherical-aberration correctors can be operated as an energy-filtered scanning confocal electron microscope. A method for establishing this mode is described and initial results showing 3D chemical mapping with nanoscale sensitivity to height and thickness changes in a carbon film are presented. Importantly, uncorrected chromatic aberration does not limit the depth resolution of this technique and moreover performs an energy-filtering role, which is explained in terms of a combined depth and energy-loss response function.

Development of a secondary electron energy analyzer for a transmission electron microscope.

Science.gov (United States)

Magara, Hideyuki; Tomita, Takeshi; Kondo, Yukihito; Sato, Takafumi; Akase, Zentaro; Shindo, Daisuke

2018-04-01

A secondary electron (SE) energy analyzer was developed for a transmission electron microscope. The analyzer comprises a microchannel plate (MCP) for detecting electrons, a coil for collecting SEs emitted from the specimen, a tube for reducing the number of backscattered electrons incident on the MCP, and a retarding mesh for selecting the energy of SEs incident on the MCP. The detection of the SEs associated with charging phenomena around a charged specimen was attempted by performing electron holography and SE spectroscopy using the energy analyzer. The results suggest that it is possible to obtain the energy spectra of SEs using the analyzer and the charging states of a specimen by electron holography simultaneously.

The Design and Construction of a Simple Transmission Electron Microscope for Educational Purposes.

Science.gov (United States)

Hearsey, Paul K.

This document presents a model for a simple transmission electron microscope for educational purposes. This microscope could demonstrate thermonic emission, particle acceleration, electron deflection, and flourescence. It is designed to be used in high school science courses, particularly physics, taking into account the size, weight, complexity…

Direct observation of dopant distribution in GaAs compound semiconductors using phase-shifting electron holography and Lorentz microscopy.

Science.gov (United States)

Sasaki, Hirokazu; Otomo, Shinya; Minato, Ryuichiro; Yamamoto, Kazuo; Hirayama, Tsukasa

2014-06-01

Phase-shifting electron holography and Lorentz microscopy were used to map dopant distributions in GaAs compound semiconductors with step-like dopant concentration. Transmission electron microscope specimens were prepared using a triple beam focused ion beam (FIB) system, which combines a Ga ion beam, a scanning electron microscope, and an Ar ion beam to remove the FIB damaged layers. The p-n junctions were clearly observed in both under-focused and over-focused Lorentz microscopy images. A phase image was obtained by using a phase-shifting reconstruction method to simultaneously achieve high sensitivity and high spatial resolution. Differences in dopant concentrations between 1 × 10(19) cm(-3) and 1 × 10(18) cm(-3) regions were clearly observed by using phase-shifting electron holography. We also interpreted phase profiles quantitatively by considering inactive layers induced by ion implantation during the FIB process. The thickness of an inactive layer at different dopant concentration area can be measured from the phase image. © The Author 2014. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oup.com.

Damage-free vibrational spectroscopy of biological materials in the electron microscope.

Science.gov (United States)

Rez, Peter; Aoki, Toshihiro; March, Katia; Gur, Dvir; Krivanek, Ondrej L; Dellby, Niklas; Lovejoy, Tracy C; Wolf, Sharon G; Cohen, Hagai

2016-03-10

Vibrational spectroscopy in the electron microscope would be transformative in the study of biological samples, provided that radiation damage could be prevented. However, electron beams typically create high-energy excitations that severely accelerate sample degradation. Here this major difficulty is overcome using an 'aloof' electron beam, positioned tens of nanometres away from the sample: high-energy excitations are suppressed, while vibrational modes of energies electron energy loss spectra from biogenic guanine crystals in their native state, resolving their characteristic C-H, N-H and C=O vibrational signatures with no observable radiation damage. The technique opens up the possibility of non-damaging compositional analyses of organic functional groups, including non-crystalline biological materials, at a spatial resolution of ∼10 nm, simultaneously combined with imaging in the electron microscope.

Acute radiation nephritis. Light and electron microscopic observations

International Nuclear Information System (INIS)

Kapur, S.; Chandra, R.; Antonovych, T.

1977-01-01

Light and electron microscopy were used to observe acute radiation nephritis. By light microscopy the changes were of fibrinoid necrosis of the arteries and arterioles with segmental necrosis of the glomerular tufts. By electron microscopy the endocapillary cells reacted by hypertrophy and hyperplasia with increase in cytoplasmic organelles. In addition, disruption of endothelial and epithelial cells from the basement membranes were seen. It is concluded that the electron microscopic changes were unique and may be helpful in differentiating the necrotizing glomerulitis seen in other conditions, especially malignant hypertension

Software for imaging phase-shift interference microscope

Science.gov (United States)

Malinovski, I.; França, R. S.; Couceiro, I. B.

2018-03-01

In recent years absolute interference microscope was created at National Metrology Institute of Brazil (INMETRO). The instrument by principle of operation is imaging phase-shifting interferometer (PSI) equipped with two stabilized lasers of different colour as traceable reference wavelength sources. We report here some progress in development of the software for this instrument. The status of undergoing internal validation and verification of the software is also reported. In contrast with standard PSI method, different methodology of phase evaluation is applied. Therefore, instrument specific procedures for software validation and verification are adapted and discussed.

Heat- and radiation-resistant scintillator for electron microscopes

International Nuclear Information System (INIS)

Kosov, A.V.; Petrov, S.A.; Puzyr', A.P.; Chetvergov, N.A.

1987-01-01

The use of a scintillator consisting of a single crystal of bismuth orthogermanate, which has high heat and radiation resistance, in REM-100, REM-200, and REM-100U electron microscopes is described. A study of the heat and radiation stabilities of single crystals of bismuth orthogermanate (Bi 4 Ge 3 O 12 ) has shown that they withstood multiple electron-beam heating redness (T ∼ 800 0 C) without changes in their properties

Spherical aberration correction in a scanning transmission electron microscope using a sculpted thin film.

Science.gov (United States)

Shiloh, Roy; Remez, Roei; Lu, Peng-Han; Jin, Lei; Lereah, Yossi; Tavabi, Amir H; Dunin-Borkowski, Rafal E; Arie, Ady

2018-06-01

Nearly eighty years ago, Scherzer showed that rotationally symmetric, charge-free, static electron lenses are limited by an unavoidable, positive spherical aberration. Following a long struggle, a major breakthrough in the spatial resolution of electron microscopes was reached two decades ago by abandoning the first of these conditions, with the successful development of multipole aberration correctors. Here, we use a refractive silicon nitride thin film to tackle the second of Scherzer's constraints and demonstrate an alternative method for correcting spherical aberration in a scanning transmission electron microscope. We reveal features in Si and Cu samples that cannot be resolved in an uncorrected microscope. Our thin film corrector can be implemented as an immediate low cost upgrade to existing electron microscopes without re-engineering of the electron column or complicated operation protocols and can be extended to the correction of additional aberrations. Copyright © 2018 The Authors. Published by Elsevier B.V. All rights reserved.

Development of an environmental high-voltage electron microscope for reaction science.

Science.gov (United States)

Tanaka, Nobuo; Usukura, Jiro; Kusunoki, Michiko; Saito, Yahachi; Sasaki, Katuhiro; Tanji, Takayoshi; Muto, Shunsuke; Arai, Shigeo

2013-02-01

Environmental transmission electron microscopy and ultra-high resolution electron microscopic observation using aberration correctors have recently emerged as topics of great interest. The former method is an extension of the so-called in situ electron microscopy that has been performed since the 1970s. Current research in this area has been focusing on dynamic observation with atomic resolution under gaseous atmospheres and in liquids. Since 2007, Nagoya University has been developing a new 1-MV high voltage (scanning) transmission electron microscope that can be used to observe nanomaterials under conditions that include the presence of gases, liquids and illuminating lights, and it can be also used to perform mechanical operations to nanometre-sized areas as well as electron tomography and elemental analysis by electron energy loss spectroscopy. The new instrument has been used to image and analyse various types of samples including biological ones.

Analysis of hydrogen distribution on Mg-Ni alloy surface by scanning electron-stimulated desorption ion microscope (SESDIM)

International Nuclear Information System (INIS)

Yamaga, Atsushi; Hibino, Kiyohide; Suzuki, Masanori; Yamada, Masaaki; Tanaka, Kazuhide; Ueda, Kazuyuki

2008-01-01

Hydrogen distribution and behavior on a Mg-Ni alloy surface are studied by using a time-of-flight electron-stimulated desorption (TOF-ESD) microscopy and a scanning electron microscope with energy dispersive X-ray spectroscopy (SEM-EDX). The desorbed hydrogen ions are energy-discriminated and distinguished into two characters in the adsorbed states, which belong to Mg 2 Ni grains and the other to oxygen-contaminated Mg phase at the grain boundaries. Adsorbed hydrogen is found to be stable up to 150 deg. C, but becomes thermally unstable around at 200 deg. C

Closed-Loop Autofocus Scheme for Scanning Electron Microscope

Directory of Open Access Journals (Sweden)

Cui Le

2015-01-01

Full Text Available In this paper, we present a full scale autofocus approach for scanning electron microscope (SEM. The optimal focus (in-focus position of the microscope is achieved by maximizing the image sharpness using a vision-based closed-loop control scheme. An iterative optimization algorithm has been designed using the sharpness score derived from image gradient information. The proposed method has been implemented and validated using a tungsten gun SEM at various experimental conditions like varying raster scan speed, magnification at real-time. We demonstrate that the proposed autofocus technique is accurate, robust and fast.

Dual ion beam irradiation system for in situ observation with electron microscope

International Nuclear Information System (INIS)

Tsukamoto, Tetuo; Hojou, Kiiti; Furuno, Sigemi; Otsu, Hitosi; Izui, Kazuhiko.

1993-01-01

We have developed a new in situ observation system for dynamic processes under dual ion beam irradiation. The system consists of a modified 400 keV analytical electron microscope (JEOL, JEM-4000FX) and two 40 kV ion beam accelerators. This system allows evaluation of microscopic changes of structure and chemical bonding state of materials in the dynamic processes under two kinds of ion beam irradiations, that is required for the simulation test of the first wall of nuclear fusion reactors onto which He + , H + , and H 2 + ions are irradiated simultaneously. These two ion accelerators were equipped symmetrically both sides of the electron microscope and individually controlled. Each ion beam extracted from a duo-plasmatron ion gun is bent downward by an angle of 30deg with a mass-separating magnet, and introduced into specimen chamber of the electron microscope. Inside the specimen chamber the beam is deflected again by an angle of 30deg with an electrostatic prism so as to be incident on the specimen surface. Finally, two ion beams from both side are incident on the specimen surface at an angle of 60deg. The maximum ion current density of helium is more than 250μA/cm 2 at the specimen at an ion energy of 17 keV. Images of the electron microscope during dual ion beam irradiation are observed through a TV camera and recorded with a VTR. (author)

Study of Scanning Tunneling Microscope control electronics

International Nuclear Information System (INIS)

Oliva, A.J.; Pancarobo, M.; Denisenko, N.; Aguilar, M.; Rejon, V.; Pena, J.L.

1994-01-01

A theoretical study of Scanning Tunneling Microscope control electronics is made. The knowledge of its behaviour allows us to determine accurately the region where the unstable operation could effect the measurements, and also to set the optimal working parameters. Each feedback circuitry compound is discussed as well as their mutual interaction. Different working conditions analysis and results are presented. (Author) 12 refs

Transmission electron microscopical study of teenage crown dentin on the nanometer scale

Energy Technology Data Exchange (ETDEWEB)

Panfilov, Peter, E-mail: peter.panfilov@urfu.ru [Ural Federal University, Ekaterinburg (Russian Federation); Kabanova, Anna [Ural Federal University, Ekaterinburg (Russian Federation); Guo, Jinming; Zhang, Zaoli [Erich Schmid Institute for Materials Science, Austrian Academy of Sciences, Leoben (Austria)

2017-02-01

Statement of significance: This is the first transmission electron microscopic study of teenage crown dentin on the nanometer scale. Samples for TEM were prepared by mechanical thinning and chemical polishing that allowed obtaining the electron transparent foils. It was firstly shown that human dentin possesses the layered morphology: the layers are oriented normally to the main axis of a tooth and have the thickness of ~ 50 nm. HA inorganic phase of teenage crown dentin is in the amorphous state. The cellular structure, which was formed from collagen fibers (diameter is ~ 5 nm), are observed near DEJ region in teenage dentin, whereas bioorganic phase of teenage crown dentin near the pulp camera does not contain the collagen fibers. Cracks in dentin thin foils have sharp tips, but big angles of opening (~ 30{sup °}) with plastic zone ahead crack tip. It means that young crown human dentin exhibits ductile or viscous-elastic fracture behavior on the nanometer scale. - Highlights: • Dentin has layered morphology. • Mineral component of dentin is in amorphous state. • Collagen fibers form cellular structure in dentin. • Cracks in dentin behave by elastic-plastic manner.

Transmission electron microscopical study of teenage crown dentin on the nanometer scale

International Nuclear Information System (INIS)

Panfilov, Peter; Kabanova, Anna; Guo, Jinming; Zhang, Zaoli

2017-01-01

Statement of significance: This is the first transmission electron microscopic study of teenage crown dentin on the nanometer scale. Samples for TEM were prepared by mechanical thinning and chemical polishing that allowed obtaining the electron transparent foils. It was firstly shown that human dentin possesses the layered morphology: the layers are oriented normally to the main axis of a tooth and have the thickness of ~ 50 nm. HA inorganic phase of teenage crown dentin is in the amorphous state. The cellular structure, which was formed from collagen fibers (diameter is ~ 5 nm), are observed near DEJ region in teenage dentin, whereas bioorganic phase of teenage crown dentin near the pulp camera does not contain the collagen fibers. Cracks in dentin thin foils have sharp tips, but big angles of opening (~ 30 ° ) with plastic zone ahead crack tip. It means that young crown human dentin exhibits ductile or viscous-elastic fracture behavior on the nanometer scale. - Highlights: • Dentin has layered morphology. • Mineral component of dentin is in amorphous state. • Collagen fibers form cellular structure in dentin. • Cracks in dentin behave by elastic-plastic manner.

In-focus electron microscopy of frozen-hydrated biological samples with a Boersch phase plate

Energy Technology Data Exchange (ETDEWEB)

Barton, B.; Rhinow, D.; Walter, A.; Schroeder, R. [Max Planck Institute of Biophysics, Max-von-Laue Str. 3, 60438 Frankfurt am Main (Germany); Benner, G.; Majorovits, E.; Matijevic, M.; Niebel, H. [Carl Zeiss NTS GmbH, D-73447 Oberkochen (Germany); Mueller, H.; Haider, M. [CEOS GmbH, Englerstr. 26, 69126 Heidleberg (Germany); Lacher, M.; Schmitz, S.; Holik, P. [Caesar Research Center, Ludwig-Erhard-Allee 2, D-53175 Bonn (Germany); Kuehlbrandt, W., E-mail: werner.kuehlbrandt@mpibp-frankfurt.mpg.de [Max Planck Institute of Biophysics, Max-von-Laue Str. 3, 60438 Frankfurt am Main (Germany)

2011-12-15

We report the implementation of an electrostatic Einzel lens (Boersch) phase plate in a prototype transmission electron microscope dedicated to aberration-corrected cryo-EM. The combination of phase plate, C{sub s} corrector and Diffraction Magnification Unit (DMU) as a new electron-optical element ensures minimal information loss due to obstruction by the phase plate and enables in-focus phase contrast imaging of large macromolecular assemblies. As no defocussing is necessary and the spherical aberration is corrected, maximal, non-oscillating phase contrast transfer can be achieved up to the information limit of the instrument. A microchip produced by a scalable micro-fabrication process has 10 phase plates, which are positioned in a conjugate, magnified diffraction plane generated by the DMU. Phase plates remained fully functional for weeks or months. The large distance between phase plate and the cryo sample permits the use of an effective anti-contaminator, resulting in ice contamination rates of <0.6 nm/h at the specimen. Maximal in-focus phase contrast was obtained by applying voltages between 80 and 700 mV to the phase plate electrode. The phase plate allows for in-focus imaging of biological objects with a signal-to-noise of 5-10 at a resolution of 2-3 nm, as demonstrated for frozen-hydrated virus particles and purple membrane at liquid-nitrogen temperature. -- Highlights: Black-Right-Pointing-Pointer We implement an electrostatic Boersch phase plate into a dedicated prototypical TEM. Black-Right-Pointing-Pointer Phase contrast aberration-corrected electron microscope (PACEM) includes a diffraction magnification unit (DMU). Black-Right-Pointing-Pointer DMU minimizes obstruction of low spatial frequencies by the phase plate. Black-Right-Pointing-Pointer In-focus phase contrast generation is demonstrated for frozen-hydrated biological specimens.

Interaction of electrons with light metal hydrides in the transmission electron microscope.

Science.gov (United States)

Wang, Yongming; Wakasugi, Takenobu; Isobe, Shigehito; Hashimoto, Naoyuki; Ohnuki, Somei

2014-12-01

Transmission electron microscope (TEM) observation of light metal hydrides is complicated by the instability of these materials under electron irradiation. In this study, the electron kinetic energy dependences of the interactions of incident electrons with lithium, sodium and magnesium hydrides, as well as the constituting element effect on the interactions, were theoretically discussed, and electron irradiation damage to these hydrides was examined using in situ TEM. The results indicate that high incident electron kinetic energy helps alleviate the irradiation damage resulting from inelastic or elastic scattering of the incident electrons in the TEM. Therefore, observations and characterizations of these materials would benefit from increased, instead decreased, TEM operating voltage. © The Author 2014. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oup.com.

Transmission environmental scanning electron microscope with scintillation gaseous detection device.

Science.gov (United States)

Danilatos, Gerasimos; Kollia, Mary; Dracopoulos, Vassileios

2015-03-01

A transmission environmental scanning electron microscope with use of a scintillation gaseous detection device has been implemented. This corresponds to a transmission scanning electron microscope but with addition of a gaseous environment acting both as environmental and detection medium. A commercial type of low vacuum machine has been employed together with appropriate modifications to the detection configuration. This involves controlled screening of various emitted signals in conjunction with a scintillation gaseous detection device already provided with the machine for regular surface imaging. Dark field and bright field imaging has been obtained along with other detection conditions. With a progressive series of modifications and tests, the theory and practice of a novel type of microscopy is briefly shown now ushering further significant improvements and developments in electron microscopy as a whole. Copyright © 2014 Elsevier B.V. All rights reserved.

Atmospheric scanning electron microscope observes cells and tissues in open medium through silicon nitride film.

Science.gov (United States)

Nishiyama, Hidetoshi; Suga, Mitsuo; Ogura, Toshihiko; Maruyama, Yuusuke; Koizumi, Mitsuru; Mio, Kazuhiro; Kitamura, Shinichi; Sato, Chikara

2010-03-01

Direct observation of subcellular structures and their characterization is essential for understanding their physiological functions. To observe them in open environment, we have developed an inverted scanning electron microscope with a detachable, open-culture dish, capable of 8 nm resolution, and combined with a fluorescence microscope quasi-simultaneously observing the same area from the top. For scanning electron microscopy from the bottom, a silicon nitride film window in the base of the dish maintains a vacuum between electron gun and open sample dish while allowing electrons to pass through. Electrons are backscattered from the sample and captured by a detector under the dish. Cells cultured on the open dish can be externally manipulated under optical microscopy, fixed, and observed using scanning electron microscopy. Once fine structures have been revealed by scanning electron microscopy, their component proteins may be identified by comparison with separately prepared fluorescence-labeled optical microscopic images of the candidate proteins, with their heavy-metal-labeled or stained ASEM images. Furthermore, cell nuclei in a tissue block stained with platinum-blue were successfully observed without thin-sectioning, which suggests the applicability of this inverted scanning electron microscope to cancer diagnosis. This microscope visualizes mesoscopic-scale structures, and is also applicable to non-bioscience fields including polymer chemistry. (c) 2010 Elsevier Inc. All rights reserved.

Hard X-ray phase-contrast microscope for observing transparent specimens

Energy Technology Data Exchange (ETDEWEB)

Kagoshima, Y.; Yokoyama, Y.; Niimi, T.; Koyama, T.; Tsusaka, Y.; Matsui, J. [Himeji Institute of Technology, Graduate School of Science, Hyogo (Japan); Takai, K. [Japan synchrotron Radiation Research Institute, Mikazuki, Hyogo (Japan)

2002-08-01

A hard X-ray transmission imaging microscope has been in use at the beamline BL24XU of Spring-8. It makes use of a phase zone plate made of tantalum as its X-ray lens, and is capable of imaging the structure as fine as 125-nm line-and-space pattern. The Zernike's phase-contrast method has been implemented to the microscope with phase plates made of gold. The photon energy was tuned to 12 keV just above the L{sub 3} absorption edge of gold (11.9 keV) in order to increase the image contrast. Polystyrene micro particles as transparent specimens were imaged clearly in the opposite image contrast with phase plates to shift the phase of the central order spectra in the back focal plane of the objective by one-quarter and three-quarters of a period, while the absorption contrast image showed little image contrast. Performance of the newly developed phase zone plate has been tested and it was confirmed that the structure as fine as 60-mm line-and-space pattern was able to be imaged. (authors)

Instrumentation at the National Center for Electron Microscopy: the Atomic Resolution Microscope

International Nuclear Information System (INIS)

Gronsky, R.; Thomas, G.

1983-01-01

The Atomic Resolution Microscope (ARM) is one of two unique high voltage electron microscopes at the Lawrence Berkeley Laboratory's National Center for Electron Microscopy (NCEM). The latest results from this new instrument which was manufactured by JEOL, Ltd. to the performance specifications of the NCEM, delivered in January of 1983, and soon to be open to access by the entire microscopy community are given. Details of its history and development are given and its performance specifications are reviewed

Indigenous development of scanning electron microscope

International Nuclear Information System (INIS)

Ambastha, K.P.; Chaudhari, Y.V.; Pal, Suvadip; Tikaria, Amit; Pious, Lizy; Dubey, B.P.; Chadda, V.K.

2009-01-01

Scanning electron microscope (SEM) is a precision instrument and plays very important role in scientific studies. Bhabha Atomic Research Centre has taken up the job of development of SEM indigenously. Standard and commercially available components like computer, high voltage power supply, detectors etc. shall be procured from market. Focusing and scanning coils, vacuum chamber, specimen stage, control hardware and software etc. shall be developed at BARC with the help of Indian industry. Procurement, design and fabrication of various parts of SEM are in progress. (author)

Development of spin-polarized transmission electron microscope

International Nuclear Information System (INIS)

Kuwahara, M; Saitoh, K; Tanaka, N; Takeda, Y; Ujihara, T; Asano, H; Nakanishi, T

2011-01-01

In order to study spin related phenomena in nano-size materials, spin-polarized electron source (PES) has been employed for the incident beam in transmission electron microscope (TEM). The PES has been designed and constructed with optimizing for spin-polarized TEM. The illuminating system of TEM is also designed to focus the spin-polarized electron beam emitted from a semiconductor photocathode with a negative electron affinity (NEA) surface. The beam energy is set to below 40 keV which is lower energy type as a TEM, because the spin interaction with condensed matters is very small corresponding with a Coulomb interaction. The polarized electron gun has realized in an extra high vacuum (XHV) condition and high field gradient of 4 MV/m on a surface of photocathode. Furthermore, it demonstrated that 40-keV polarized electron beam was operated with a sub-milli second pulse mode by using the backside excitation type photocathode. This high performance PES will make it possible to observe dynamically a magnetic field images with high contrast and highspeed temporal imaging in TEM.

An investigation of the electron irradiation of graphite in a helium atmosphere using a modified electron microscope

International Nuclear Information System (INIS)

Burden, A.P.; Hutchison, J.L.

1997-01-01

The behaviour of graphite particles immersed in helium gas and irradiated with an electron-beam has been investigated. Because this treatment was performed in a modified high resolution transmission electron microscope, the rapid morphological and microstructural changes that occurred could be directly observed. The results have implications for future controlled environment microscopy of carbonaceous materials and the characterisation of such microscopes. It is also shown that the processes can provide insight into ion-irradiation induced damage of graphite and the mechanism of fullerene generation. (Author)

Microscopic appearance analysis of raw material used for the production of sintered UO2 by scanning electron microscope

International Nuclear Information System (INIS)

Liu feiming

1992-01-01

The paper describes the microscopic appearance of UO 2 , U 3 O 8 , ADU and AUC powders used for the production of sintered UO 2 slug of nuclear fuel component of PWR. The characteristic analysis of the microscopic appearance observed by scanning electron microscope shows that the quality and finished product rate of sintered UO 2 depend on the appearance characteristic of the active Uo 2 powder, such as grade size and its distribution, spherulitized extent, surface condition and heap model etc.. The addition of U 3 O 8 to the UO 2 powder improves significantly the quality and the finished product rate. The mechanism of this effect is discussed on the basis of the microscopic appearance characteristic for two kinds of powder

Field emission from individual multiwalled carbon nanotubes prepared in an electron microscope

NARCIS (Netherlands)

de Jonge, N.; van Druten, N.J.

2003-01-01

Individual multiwalled carbon nanotube field emitters were prepared in a scanning electron microscope. The angular current density, energy spectra, and the emission stability of the field-emitted electrons were measured. An estimate of the electron source brightness was extracted from the

Spin polarized electron source technology transferred from HE accelerators to electron microscopes

International Nuclear Information System (INIS)

Nakanishi, Tsutomu

2009-01-01

For many years, we have developed a technology of spin-polarized-electron-source (PES) for a future linear collider project (ILC). Various new techniques for achieving high polarization, high quantum efficiency, high current density, sub-nanosecond multi-bunch generation etc. were developed. Two fundamental technologies; reduction of dark current and preparation of extremely high vacuum environment to protect the Negative Electron Affinity (NEA) surface have been also developed. Using these PES technologies and a new transmission type photocathode, we recently succeeded in producing the high brightness and high polarization electron beam for the low energy electron microscope (LEEM). Our Spin-LEEM system enables the world-first dynamic observation of surface magnetic domain formed by evaporation on the metal substrate with ∼ 20 nm space resolutions. (author)

A new clustering algorithm for scanning electron microscope images

Science.gov (United States)

Yousef, Amr; Duraisamy, Prakash; Karim, Mohammad

2016-04-01

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning it with a focused beam of electrons. The electrons interact with the sample atoms, producing various signals that are collected by detectors. The gathered signals contain information about the sample's surface topography and composition. The electron beam is generally scanned in a raster scan pattern, and the beam's position is combined with the detected signal to produce an image. The most common configuration for an SEM produces a single value per pixel, with the results usually rendered as grayscale images. The captured images may be produced with insufficient brightness, anomalous contrast, jagged edges, and poor quality due to low signal-to-noise ratio, grained topography and poor surface details. The segmentation of the SEM images is a tackling problems in the presence of the previously mentioned distortions. In this paper, we are stressing on the clustering of these type of images. In that sense, we evaluate the performance of the well-known unsupervised clustering and classification techniques such as connectivity based clustering (hierarchical clustering), centroid-based clustering, distribution-based clustering and density-based clustering. Furthermore, we propose a new spatial fuzzy clustering technique that works efficiently on this type of images and compare its results against these regular techniques in terms of clustering validation metrics.

Design and Development of a compact and ruggest phase and flouresence microscope for space utilization, Phase I

Data.gov (United States)

National Aeronautics and Space Administration — In this SBIR Phase 1 we propose to develop a novel microscope by integrating Fourier phase contrast microscopy (FPCM) and epi-fluorescence microscopy. In FPCM, the...

Use of a scanning electron microscope for examining radioactive materials

International Nuclear Information System (INIS)

Kauffmann, Yves; Prouve, Michel.

1981-05-01

The LAMA laboratory of the Grenoble Nuclear Research Center participates in studies carried out by research teams on fuels. Post-irradiation studies are performed on irradiated pins for research and development and safety programs. A scanning electron microscope was acquired for this purpose. This microscope had to fulfill certain criteria: it had to be sufficiently compact for it to be housed in a lead enclosure; it had to be capable of being adapted to operate with remote handling control. The modifications made to this microscope are briefly described together with the ancillary equipment of the cell. In parallel with these operations, an interconnection was realized enabling materials to be transferred between the various sampling and sample preparation cells and the microscope cell with a small transfer cask. After two years operating experience the microscope performance has been assessed satisfactory. The specific radioactivity of the samples themselves cannot be incriminated as the only cause of loss in resolution at magnifications greater than x 10,000 [fr

Digital phase-shifting atomic force microscope Moire method

International Nuclear Information System (INIS)

Liu Chiaming; Chen Lienwen

2005-01-01

In this study, the digital atomic force microscope (AFM) Moire method with phase-shifting technology is established to measure the in-plane displacement and strain fields. The Moire pattern is generated by the interference between the specimen grating and the virtual reference grating formed by digital image processes. The overlapped image is filtered by two-dimensional wavelet transformation to obtain the clear interference Moire patterns. The four-step phase-shifting method is realized by translating the phase of the virtual reference grating from 0 to 2π. The principle of the digital AFM Moire method and the phase-shifting technology are described in detail. Experimental results show that this method is convenient to use and efficient in realizing the microscale measurement

Structure Identification in High-Resolution Transmission Electron Microscopic Images

DEFF Research Database (Denmark)

Vestergaard, Jacob Schack; Kling, Jens; Dahl, Anders Bjorholm

2014-01-01

A connection between microscopic structure and macroscopic properties is expected for almost all material systems. High-resolution transmission electron microscopy is a technique offering insight into the atomic structure, but the analysis of large image series can be time consuming. The present ...

Three-Dimensional Orientation Mapping in the Transmission Electron Microscope

DEFF Research Database (Denmark)

Liu, Haihua; Schmidt, Søren; Poulsen, Henning Friis

2011-01-01

resolution of 200 nanometers (nm). We describe here a nondestructive technique that enables 3D orientation mapping in the transmission electron microscope of mono- and multiphase nanocrystalline materials with a spatial resolution reaching 1 nm. We demonstrate the technique by an experimental study...

Some applications of the high voltage electron microscope in physical metallurgy

International Nuclear Information System (INIS)

Regnier, P.; Thomas de Montpreville, C.

1976-01-01

The high voltage electron microscope (HVEM) is a microscope with a much higher penetration than the usual ones, as well as being a remarkable irradiation machine. The possible applications of the HVEM related to its advantages over the conventional microscopes are first discussed. The simultaneous use of the HVEM as an irradiation machine and an observation tool is then discussed, experiments carried in the laboratory being referred to. The last use of the HVEM makes it an irreplaceable tool for continuously following the clustering of irradiation defects [fr

Minimal exposure technique in the Cambridge University 600kV high resolution electron microscope

International Nuclear Information System (INIS)

Fryer, J.R.; Cleaver, J.R.A.; Smith, D.J.

1980-01-01

Radiation damage due to the incident electron beam imposes a fundamental limitation on the information obtainable by electron microscopy about organic materials; it is desirable therefore that exposure of the specimen to the electron beam should be restricted to the actual period during which the image is being recorded. A description is given of methods employed in the observation of the organic aromatic hydrocarbons quaterrylene, ovalene and coronene with the Cambridge University 600kV high resolution electron microscope (HREM). In particular, the condenser-objective mode of operation of this microscope lends itself to the use of an area-defining aperture below the second condenser lens conjugate with the specimen. Furthermore, operation at the higher accelerating voltage of this instrument could be anticipated to reduce the rate of damage, depending on the dominant beam-specimen interaction, whilst the increased width of the first broad band of the contrast transfer function of this microscope at the optimum defocus may overcome the reported resolution limitation of current 100kV microscopes for the observation of related materials. (author)

Spectro-refractometry of individual microscopic objects using swept-source quantitative phase imaging.

Science.gov (United States)

Jung, Jae-Hwang; Jang, Jaeduck; Park, Yongkeun

2013-11-05

We present a novel spectroscopic quantitative phase imaging technique with a wavelength swept-source, referred to as swept-source diffraction phase microscopy (ssDPM), for quantifying the optical dispersion of microscopic individual samples. Employing the swept-source and the principle of common-path interferometry, ssDPM measures the multispectral full-field quantitative phase imaging and spectroscopic microrefractometry of transparent microscopic samples in the visible spectrum with a wavelength range of 450-750 nm and a spectral resolution of less than 8 nm. With unprecedented precision and sensitivity, we demonstrate the quantitative spectroscopic microrefractometry of individual polystyrene beads, 30% bovine serum albumin solution, and healthy human red blood cells.

Electron microscopic evaluation of a gold glaucoma micro shunt after explantation.

Science.gov (United States)

Berk, Thomas A; Tam, Diamond Y; Werner, Liliana; Mamalis, Nick; Ahmed, Iqbal Ike K

2015-03-01

We present a case of an explanted gold glaucoma micro shunt (GMS Plus) and the subsequent light and electron microscopic analyses. The shunt was implanted in a patient with medically refractive glaucoma. The intraocular pressure (IOP) was stable at 12 mm Hg 6 months postoperatively but spiked to 26 mm Hg 6 months later; membranous growth was visible on the implant gonioscopically. A second gold micro shunt was placed 2 years after the first. The IOP was 7 mm Hg 1 week postoperatively but increased to 23 mm Hg 3 weeks later; similar membranous growth was visible on this implant. One of the shunts was explanted, and light and scanning electron microscopic analyses revealed encapsulation around the shunt exterior and connective tissue invasion of the microstructure. This represents the first electron microscopic analysis of an explanted gold glaucoma micro shunt and the first unequivocal images of the fibrotic pseudo-capsule traversing its microchannels and fenestrations. Dr. Ahmed is a consultant to and has received research grants from Solx, Inc. No other author has a financial or proprietary interest in any material or method mentioned. Copyright © 2015 ASCRS and ESCRS. Published by Elsevier Inc. All rights reserved.

A transmission positron microscope and a scanning positron microscope being built at KEK, Japan

International Nuclear Information System (INIS)

Doyama, M.; Inoue, M.; Kogure, Y.; Kurihara, T.; Yagishita, A.; Shidara, T.; Nakahara, K.; Hayashi, Y.; Yoshiie, T.

2001-01-01

This paper reports the plans of positron microscopes being built at KEK (High Energy Accelerator Research Organization), Tsukuba, Japan improving used electron microscopes. The kinetic energies of positron produced by accelerators or by nuclear decays have not a unique value but show a spread over in a wide range. Positron beam will be guided near electron microscopes, a transmission electron microscope (JEM100S) and a scanning electron microscope (JSM25S). Positrons are slowed down by a tungsten foil, accelerated and focused on a nickel sheet. The monochromatic focused beam will be injected into an electron microscope. The focusing of positrons and electrons is achieved by magnetic system of the electron microscopes. Imaging plates are used to record positron images for the transmission electron microscope. (orig.)

Three-dimensional optical transfer functions in the aberration-corrected scanning transmission electron microscope.

Science.gov (United States)

Jones, L; Nellist, P D

2014-05-01

In the scanning transmission electron microscope, hardware aberration correctors can now correct for the positive spherical aberration of round electron lenses. These correctors make use of nonround optics such as hexapoles or octupoles, leading to the limiting aberrations often being of a nonround type. Here we explore the effect of a number of potential limiting aberrations on the imaging performance of the scanning transmission electron microscope through their resulting optical transfer functions. In particular, the response of the optical transfer function to changes in defocus are examined, given that this is the final aberration to be tuned just before image acquisition. The resulting three-dimensional optical transfer functions also allow an assessment of the performance of a system for focal-series experiments or optical sectioning applications. © 2014 The Authors Journal of Microscopy © 2014 Royal Microscopical Society.

In situ disordering of monoclinic titanium monoxide Ti5O5 studied by transmission electron microscope TEM.

Science.gov (United States)

Rempel, А А; Van Renterghem, W; Valeeva, А А; Verwerft, M; Van den Berghe, S

2017-09-07

The superlattice and domain structures exhibited by ordered titanium monoxide Ti 5 O 5 are disrupted by low energy electron beam irradiation. The effect is attributed to the disordering of the oxygen and titanium sublattices. This disordering is caused by the displacement of both oxygen and titanium atoms by the incident electrons and results in a phase transformation of the monoclinic phase Ti 5 O 5 into cubic B1 titanium monoxide. In order to determine the energies required for the displacement of titanium or oxygen atoms, i.e. threshold displacement energies, a systematic study of the disappearance of superstructure reflections with increasing electron energy and electron bombardment dose has been performed in situ in a transmission electron microscope (TEM). An incident electron energy threshold between 120 and 140 keV has been observed. This threshold can be ascribed to the displacements of titanium atoms with 4 as well as with 5 oxygen atoms as nearest neighbors. The displacement threshold energy of titanium atoms in Ti 5 O 5 corresponding with the observed incident electron threshold energy lies between 6.0 and 7.5 eV. This surprisingly low value can be explained by the presence of either one or two vacant oxygen lattice sites in the nearest neighbors of all titanium atoms.

Transmission positron microscopes

International Nuclear Information System (INIS)

Doyama, Masao; Kogure, Yoshiaki; Inoue, Miyoshi; Kurihara, Toshikazu; Yoshiie, Toshimasa; Oshima, Ryuichiro; Matsuya, Miyuki

2006-01-01

Immediate and near-future plans for transmission positron microscopes being built at KEK, Tsukuba, Japan, are described. The characteristic feature of this project is remolding a commercial electron microscope to a positron microscope. A point source of electrons kept at a negative high voltage is changed to a point source of positrons kept at a high positive voltage. Positional resolution of transmission microscopes should be theoretically the same as electron microscopes. Positron microscopes utilizing trapping of positrons have always positional ambiguity due to the diffusion of positrons

Electron Source Brightness and Illumination Semi-Angle Distribution Measurement in a Transmission Electron Microscope.

Science.gov (United States)

Börrnert, Felix; Renner, Julian; Kaiser, Ute

2018-05-21

The electron source brightness is an important parameter in an electron microscope. Reliable and easy brightness measurement routes are not easily found. A determination method for the illumination semi-angle distribution in transmission electron microscopy is even less well documented. Herein, we report a simple measurement route for both entities and demonstrate it on a state-of-the-art instrument. The reduced axial brightness of the FEI X-FEG with a monochromator was determined to be larger than 108 A/(m2 sr V).

A new approach to nuclear microscopy: The ion-electron emission microscope

International Nuclear Information System (INIS)

Doyle, B.L.; Vizkelethy, G.; Walsh, D.S.; Senftinger, B.; Mellon, M.

1998-01-01

A new multidimensional high lateral resolution ion beam analysis technique, Ion-Electron Emission Microscopy or IEEM is described. Using MeV energy ions, IEEM is shown to be capable of Ion Beam Induced Charge Collection (IBICC) measurements in semiconductors. IEEM should also be capable of microscopically and multidimensionally mapping the surface and bulk composition of solids. As such, IIEM has nearly identical capabilities as traditional nuclear microprobe analysis, with the advantage that the ion beam does not have to be focused. The technique is based on determining the position where an individual ion enters the surface of the sample by projection secondary electron emission microscopy. The x-y origination point of a secondary electron, and hence the impact coordinates of the corresponding incident ion, is recorded with a position sensitive detector connected to a standard photoemission electron microscope (PEEM). These signals are then used to establish coincidence with IBICC, atomic, or nuclear reaction induced ion beam analysis signals simultaneously caused by the incident ion

Invited Review Article: Methods for imaging weak-phase objects in electron microscopy

International Nuclear Information System (INIS)

Glaeser, Robert M.

2013-01-01

Contrast has traditionally been produced in electron-microscopy of weak phase objects by simply defocusing the objective lens. There now is renewed interest, however, in using devices that apply a uniform quarter-wave phase shift to the scattered electrons relative to the unscattered beam, or that generate in-focus image contrast in some other way. Renewed activity in making an electron-optical equivalent of the familiar “phase-contrast” light microscope is based in part on the improved possibilities that are now available for device microfabrication. There is also a better understanding that it is important to take full advantage of contrast that can be had at low spatial frequency when imaging large, macromolecular objects. In addition, a number of conceptually new phase-plate designs have been proposed, thus increasing the number of options that are available for development. The advantages, disadvantages, and current status of each of these options is now compared and contrasted. Experimental results that are, indeed, superior to what can be accomplished with defocus-based phase contrast have been obtained recently with two different designs of phase-contrast aperture. Nevertheless, extensive work also has shown that fabrication of such devices is inconsistent, and that their working lifetime is short. The main limitation, in fact, appears to be electrostatic charging of any device that is placed into the electron diffraction pattern. The challenge in fabricating phase plates that are practical to use for routine work in electron microscopy thus may be more in the area of materials science than in the area of electron optics

A design for a subminiature, low energy scanning electron microscope with atomic resolution

International Nuclear Information System (INIS)

Eastham, D. A.; Edmondson, P.; Greene, S.; Donnelly, S.; Olsson, E.; Svensson, K.; Bleloch, A.

2009-01-01

We describe a type of scanning electron microscope that works by directly imaging the electron field-emission sites on a nanotip. Electrons are extracted from the nanotip through a nanoscale aperture, accelerated in a high electric field, and focused to a spot using a microscale Einzel lens. If the whole microscope (accelerating section and lens) and the focal length are both restricted in size to below 10 μm, then computer simulations show that the effects of aberration are extremely small and it is possible to have a system with approximately unit magnification at electron energies as low as 300 eV. Thus a typical emission site of 1 nm diameter will produce an image of the same size, and an atomic emission site will give a resolution of 0.1-0.2 nm (1-2 A). Also, because the beam is not allowed to expand beyond 100 nm in diameter, the depth of field is large and the contribution to the beam spot size from chromatic aberrations is less than 0.02 nm (0.2 A) for 500 eV electrons. Since it is now entirely possible to make stable atomic sized emitters (nanopyramids), it is expected that this instrument will have atomic resolution. Furthermore the brightness of the beam is determined only by the field emission and can be up to 1x10 6 times larger than in a typical (high energy) electron microscope. The advantages of this low energy, bright-beam electron microscope with atomic resolution are described and include the possibility of it being used to rapidly sequence the human genome from a single strand of DNA as well as being able to identify atomic species directly from the elastic scattering of electrons

New Scanning Electron Microscope Used for Cryogenic Tensile Testing

CERN Multimedia

Maximilien Brice

2013-01-01

At CERN engineering department's installation for cryogenic tensile testing, the new scanning electron microscope (SEM) allows for detailed optical observations to be carried out. Using the SEM, surface coatings and tensile properties of materials can investigated in order to better understand how they behave under different conditions.

Scanning electron microscope facility for examination of radioactive materials

International Nuclear Information System (INIS)

Gibson, J.R.; Braski, D.N.

1985-02-01

An AMRAY model 1200B scanning electron microscope was modified to permit remote examination of radioactive specimens. Features of the modification include pneumatic vibration isolation of the column, motorized stage controls, improvements for monitoring vacuum, and a system for changing filaments without entering the hot cell

Soft X-ray imaging with axisymmetry microscope and electronic readout

International Nuclear Information System (INIS)

Sauneuf, A.; Cavailler, C.; Henry, Ph.; Launspach, J.; Mascureau, J. de; Rostaing, M.

1984-11-01

An axisymmetric microscope with 10 X magnification has been constructed; its resolution has been measured using severals grids, backlighted by an X-ray source and found to be near 25 μm. So it could be used to make images of laser driven plasmas in the soft X-ray region. In order to see rapidly those images we have associated it with a new detector. It is a small image converter tube with a soft X-ray photocathode and a P20 phosphor deposited on an optic fiber plate. The electronic image appearing on the screen is read by a CCD working in the spectral range. An electronic image readout chain, which is identical to those we use with streak cameras, then processes automatically and immediatly the images given by the microscope

Complex composition film condensation in the sluice device of an electron microscope

International Nuclear Information System (INIS)

Kukuev, V.I.; Lesovoj, M.V.; Vlasov, D.A.; Malygin, M.V.; Domashevskaya, Eh.P.; Tomashpol'skij, Yu.Ya.

1994-01-01

Based on the sluice device of an electron microscope a system is developed for material laser evaporation and vapor condensation on a substrate, situated in the microscope specimen holder. Substrate heating by laser radiation to 100 deg C is used. The system is applied for investigating growth of high-temperature superconductor films

Effect of high-energy electron irradiation in an electron microscope column on fluorides of alkaline earth elements (CaF2, SrF2, and BaF2)

International Nuclear Information System (INIS)

Nikolaichik, V. I.; Sobolev, B. P.; Zaporozhets, M. A.; Avilov, A. S.

2012-01-01

The effect of high-energy (150 eV) electron irradiation in an electron microscope column on crystals of fluorides of alkaline earth elements CaF 2 , SrF 2 , and BaF 2 is studied. During structural investigations by electron diffraction and electron microscopy, the electron irradiation causes chemical changes in MF 2 crystals such as the desorption of fluorine and the accumulation of oxygen in the irradiated area with the formation of oxide MO. The fluorine desorption rate increases significantly when the electron-beam density exceeds the threshold value of ∼2 × 10 3 pA/cm 2 ). In BaF 2 samples, the transformation of BaO into Ba(OH) 2 was observed when irradiation stopped. The renewal of irradiation is accompanied by the inverse transformation of Ba(OH) 2 into BaO. In the initial stage of irradiation of all MF 2 compounds, the oxide phase is in the single-crystal state with a lattice highly matched with the MF 2 matrix. When the irradiation dose is increased, the oxide phase passes to the polycrystalline phase. Gaseous products of MF 2 destruction (in the form of bubbles several nanometers in diameter) form a rectangular array with a period of ∼20 nm in the sample.

Microscopic deformation and strain hardening analysis of ferrite–bainite dual-phase steels using micro-grid method

International Nuclear Information System (INIS)

Ishikawa, Nobuyuki; Yasuda, Kyono; Sueyoshi, Hitoshi; Endo, Shigeru; Ikeda, Hiroshi; Morikawa, Tatsuya; Higashida, Kenji

2015-01-01

The local strain measurement method using nanometer-scaled micro grids printed on the surface of a specimen by an electron lithography technique (the micro-grid method) has been established. Microscopic deformation behavior of the ferrite–bainite steels with different bainite volume fraction, 16% and 40% of bainite, was evaluated. Strain localization in the ferrite phase adjacent to the ferrite/bainite boundary was clearly observed and visualized. Highly strained regions expanded toward the inner region of the ferrite phase and connected each other with an increase of macroscopic strain. The existence of hard bainite phase plays an important role for inducing strain localization in the ferrite phase by plastic constraint in the boundary parallel to the tensile direction. In order to obtain further understanding of microscopic deformation behavior, finite element analysis using the representative volume element, which is expressed by the axisymmetric unit cell containing a hard phase surrounded by a soft phase matrix, was conducted. It was found that the macroscopic stress–strain behavior of ferrite–bainite steels was well simulated by the unit cell models. Strain concentration in the ferrite phase was highly enhanced for the ferrite-40% bainite steel, and this imposed higher internal stress in the bainite phase, resulting in higher strain hardening rate in the early stage of the deformation. However, smaller ferrite volume fraction of ferrite-40% bainite steel induced bainite plastic deformation in order to fulfill the macroscopic strain of the steel. Accordingly, strain hardening capacity of the ferrite-40% bainite steel was reduced to a significant degree, resulting in a smaller uniform elongation than the ferrite-16% bainite steel

The trajectories of secondary electrons in the scanning electron microscope.

Science.gov (United States)

Konvalina, Ivo; Müllerová, Ilona

2006-01-01

Three-dimensional simulations of the trajectories of secondary electrons (SE) in the scanning electron microscope have been performed for plenty of real configurations of the specimen chamber, including all its basic components. The primary purpose was to evaluate the collection efficiency of the Everhart-Thornley detector of SE and to reveal fundamental rules for tailoring the set-ups in which efficient signal acquisition can be expected. Intuitive realizations about the easiness of attracting the SEs towards the biased front grid of the detector have shown themselves likely as false, and all grounded objects in the chamber have been proven to influence the spatial distribution of the signal-extracting field. The role of the magnetic field penetrating from inside the objective lens is shown to play an ambiguous role regarding possible support for the signal collection.

Foucault imaging by using non-dedicated transmission electron microscope

International Nuclear Information System (INIS)

Taniguchi, Yoshifumi; Matsumoto, Hiroaki; Harada, Ken

2012-01-01

An electron optical system for observing Foucault images was constructed using a conventional transmission electron microscope without any special equipment for Lorentz microscopy. The objective lens was switched off and an electron beam was converged by a condenser optical system to the crossover on the selected area aperture plane. The selected area aperture was used as an objective aperture to select the deflected beam for Foucault mode, and the successive image-forming lenses were controlled for observation of the specimen images. The irradiation area on the specimen was controlled by selecting the appropriate diameter of the condenser aperture.

Foucault imaging by using non-dedicated transmission electron microscope

Science.gov (United States)

Taniguchi, Yoshifumi; Matsumoto, Hiroaki; Harada, Ken

2012-08-01

An electron optical system for observing Foucault images was constructed using a conventional transmission electron microscope without any special equipment for Lorentz microscopy. The objective lens was switched off and an electron beam was converged by a condenser optical system to the crossover on the selected area aperture plane. The selected area aperture was used as an objective aperture to select the deflected beam for Foucault mode, and the successive image-forming lenses were controlled for observation of the specimen images. The irradiation area on the specimen was controlled by selecting the appropriate diameter of the condenser aperture.

Foucault imaging by using non-dedicated transmission electron microscope

Energy Technology Data Exchange (ETDEWEB)

Taniguchi, Yoshifumi [Science and Medical Systems Business Group, Hitachi High-Technologies Corp., Ichige, Hitachinaka, Ibaraki 312-8504 (Japan); Matsumoto, Hiroaki [Corporate Manufacturing Strategy Group, Hitachi High-Technologies Corp., Ishikawa-cho, Hitachinaka, Ibaraki 312-1991 (Japan); Harada, Ken [Central Research Laboratory, Hitachi Ltd., Hatoyama, Saitama 350-0395 (Japan)

2012-08-27

An electron optical system for observing Foucault images was constructed using a conventional transmission electron microscope without any special equipment for Lorentz microscopy. The objective lens was switched off and an electron beam was converged by a condenser optical system to the crossover on the selected area aperture plane. The selected area aperture was used as an objective aperture to select the deflected beam for Foucault mode, and the successive image-forming lenses were controlled for observation of the specimen images. The irradiation area on the specimen was controlled by selecting the appropriate diameter of the condenser aperture.

Visualization of atomic distances at the 1MV electron microscope: first results obtained on the Grenoble 1MV microscope

International Nuclear Information System (INIS)

Bourret, A.

1975-01-01

Practical and theoretical conditions for obtaining high resolution lattice images are presented. The use of a high voltage electron microscope is particularly powerful to visualize distances smaller than 3A. A 2A resolution test on (200) gold planes has been carried out on the Grenoble 1MV microscope. It would be possible at this level to study the crystalline defects such as dislocations or grain boundaries [fr

Immobilization and stretching of 5'-pyrene-terminated DNA on carbon film deposited on electron microscope grid.

Science.gov (United States)

Loukanov, Alexandre; Filipov, Chavdar; Lecheva, Marta; Emin, Saim

2015-11-01

The immobilization and stretching of randomly coiled DNA molecules on hydrophobic carbon film is a challenging microscopic technique, which possess various applications, especially for genome sequencing. In this report the pyrenyl nucleus is used as an anchor moiety to acquire higher affinity of double stranded DNA to the graphite surface. DNA and pyrene are joined through a linker composed of four aliphatic methylene groups. For the preparation of pyrene-terminated DNA a multifunctional phosphoramidite monomer compound was designed. It contains pyrenylbutoxy group as an anchor moiety for π-stacking attachment to the carbon film, 2-cyanoethyloxy, and diisopropylamino as coupling groups for conjugation to activated oligonucleotide chain or DNA molecule. This monomer derivative was suitable for incorporation into automated solid-phase DNA synthesis and was attached to the 5' terminus of the DNA chain through a phosphodiester linkage. The successful immobilization and stretching of pyrene-terminated DNA was demonstrated by conventional 100 kV transmission electron microscope. The microscopic analysis confirmed the stretched shape of the negatively charged nucleic acid pieces on the hydrophobic carbon film. © 2015 Wiley Periodicals, Inc.

A Simple Metric for Determining Resolution in Optical, Ion, and Electron Microscope Images.

Science.gov (United States)

Curtin, Alexandra E; Skinner, Ryan; Sanders, Aric W

2015-06-01

A resolution metric intended for resolution analysis of arbitrary spatially calibrated images is presented. By fitting a simple sigmoidal function to pixel intensities across slices of an image taken perpendicular to light-dark edges, the mean distance over which the light-dark transition occurs can be determined. A fixed multiple of this characteristic distance is then reported as the image resolution. The prefactor is determined by analysis of scanning transmission electron microscope high-angle annular dark field images of Si. This metric has been applied to optical, scanning electron microscope, and helium ion microscope images. This method provides quantitative feedback about image resolution, independent of the tool on which the data were collected. In addition, our analysis provides a nonarbitrary and self-consistent framework that any end user can utilize to evaluate the resolution of multiple microscopes from any vendor using the same metric.

High resolution transmission electron microscopic study of nanoporous carbon consisting of curved single graphite sheets

International Nuclear Information System (INIS)

Bourgeois, L.N.; Bursill, L.A.

1997-01-01

A high resolution transmission electron microscopic study of a nanoporous carbon rich in curved graphite monolayers is presented. Observations of very thin regions. including the effect of tilting the specimen with respect to the electron beam, are reported. The initiation of single sheet material on an oriented graphite substrate is also observed. When combined with image simulations and independent measurements of the density (1.37g cm -3 ) and sp 3 /sp 2 +sp 2 bonding fraction (0.16), these observations suggest that this material is a two phase mixture containing a relatively low density aggregation of essentially capped single shells like squat nanotubes and polyhedra, plus a relatively dense 'amorphous' carbon structure which may be described using a random-Schwarzite model. Some negatively-curved sheets were also identified in the low density phase. Finally, some discussion is offered regarding the growth mechanisms responsible for this nanoporous carbon and its relationship with the structures of amorphous carbons across a broad range of densities, porosities and sp 3 /sp 2 +sp 3 bonding fractions

In-Situ Microprobe Observations of Dispersed Oil with Low-Temperature Low-Vacuum Scanning Electron Microscope

International Nuclear Information System (INIS)

Mohsen, H.T.

2010-01-01

A low cost cryostat stage from high heat capacity material is designed and constructed, in attempt to apply size distribution techniques for examination of oil dispersions. Different materials were tested according to their heat capacity to keep the liquid under investigation in frozen state as long as possible during the introduction of the cryostat stage to the low-vacuum scanning electron microscope. Different concentrations of non ionic surfactant were added to artificially contaminated with 10000 ppm Balayeam base oil in 3.5 % saline water, where oil and dispersing liquid have been added and shacked well to be investigated under the microscope as fine frozen droplets. The efficiency of dispersion was examined using low temperature low-vacuum scanning electron microscope. The shape and size distributions of freeze oil droplets were studied by digital imaging processing technique in conjunction with scanning electron microscope counting method. Also elemental concentration of oil droplets was analyzed.

Nanometer-scale lithography on microscopically clean graphene

International Nuclear Information System (INIS)

Van Dorp, W F; De Hosson, J Th M; Zhang, X; Feringa, B L; Wagner, J B; Hansen, T W

2011-01-01

Focused-electron-beam-induced deposition, or FEBID, enables the fabrication of patterns with sub-10 nm resolution. The initial stages of metal deposition by FEBID are still not fundamentally well understood. For these investigations, graphene, a one-atom-thick sheet of carbon atoms in a hexagonal lattice, is ideal as the substrate for FEBID writing. In this paper, we have used exfoliated few-layer graphene as a support to study the early growth phase of focused-electron-beam-induced deposition and to write patterns with dimensions between 0.6 and 5 nm. The results obtained here are compared to the deposition behavior on amorphous materials. Prior to the deposition experiment, the few-layer graphene was cleaned. Typically, it is observed in electron microscope images that areas of microscopically clean graphene are surrounded by areas with amorphous material. We present a method to remove the amorphous material in order to obtain large areas of microscopically clean graphene flakes. After cleaning, W(CO) 6 was used as the precursor to study the early growth phase of FEBID deposits. It was observed that preferential adsorption of the precursor molecules on step edges and adsorbates plays a key role in the deposition on cleaned few-layer graphene.

Reprint of: Atmospheric scanning electron microscope observes cells and tissues in open medium through silicon nitride film.

Science.gov (United States)

Nishiyama, Hidetoshi; Suga, Mitsuo; Ogura, Toshihiko; Maruyama, Yuusuke; Koizumi, Mitsuru; Mio, Kazuhiro; Kitamura, Shinichi; Sato, Chikara

2010-11-01

Direct observation of subcellular structures and their characterization is essential for understanding their physiological functions. To observe them in open environment, we have developed an inverted scanning electron microscope with a detachable, open-culture dish, capable of 8 nm resolution, and combined with a fluorescence microscope quasi-simultaneously observing the same area from the top. For scanning electron microscopy from the bottom, a silicon nitride film window in the base of the dish maintains a vacuum between electron gun and open sample dish while allowing electrons to pass through. Electrons are backscattered from the sample and captured by a detector under the dish. Cells cultured on the open dish can be externally manipulated under optical microscopy, fixed, and observed using scanning electron microscopy. Once fine structures have been revealed by scanning electron microscopy, their component proteins may be identified by comparison with separately prepared fluorescence-labeled optical microscopic images of the candidate proteins, with their heavy-metal-labeled or stained ASEM images. Furthermore, cell nuclei in a tissue block stained with platinum-blue were successfully observed without thin-sectioning, which suggests the applicability of this inverted scanning electron microscope to cancer diagnosis. This microscope visualizes mesoscopic-scale structures, and is also applicable to non-bioscience fields including polymer chemistry. Copyright © 2010 Elsevier Inc. All rights reserved.

Electron-beam-induced structure transformation of the quasicrystalline phases of the Al 62Cu 20Co 15Si 3 alloy

Science.gov (United States)

Reyes-Gasga, J.; R. Garcia, G.; Jose-Yacaman, M.

1995-02-01

Some details on the phase transformation experienced by the quasicrystalline phases of the Al 62Cu 20Co 15Si 3 alloy under a 400 kV electron beam are given. The transition is observed in situ with a high resolution electron microscope and recorded on video tape. The results show that the electron beam radiation produces a sequence of changes similar to the ones observed in an ion-beam-induced amorphization process. Considering electron radiation damage analysis, the results agree well with the "flip-flop" model [Coddens, Bellisent, Calvayrac and Ambroise (1991) Europhys. Lett.16, 271] where the transition from a quasicrystalline phase to a crystalline phase is produced by atomic displacements but not in a cascade way.

Sculpturing the electron wave function using nanoscale phase masks

Energy Technology Data Exchange (ETDEWEB)

Shiloh, Roy, E-mail: royshilo@post.tau.ac.il; Lereah, Yossi; Lilach, Yigal; Arie, Ady

2014-09-15

Electron beams are extensively used in lithography, microscopy, material studies and electronic chip inspection. Today, beams are mainly shaped using magnetic or electric forces, enabling only simple shaping tasks such as focusing or scanning. Recently, binary amplitude gratings achieved complex shapes. These, however, generate multiple diffraction orders, hence the desired shape, appearing only in one order, retains little of the beam energy. Here we demonstrate a method in electron-optics for arbitrarily shaping electron beams into a single desired shape, by precise patterning of a thin-membrane. It is conceptually similar to shaping light beams using refractive or diffractive glass elements such as lenses or holograms – rather than applying electromagnetic forces, the beam is controlled by spatially modulating its wavefront. Our method allows for nearly-maximal energy transference to the designed shape, and may avoid physical damage and charging effects that are the scorn of commonly-used (e.g. Zernike and Hilbert) phase-plates. The experimental demonstrations presented here – on-axis Hermite–Gauss and Laguerre–Gauss (vortex) beams, and computer-generated holograms – are a first example of nearly-arbitrary manipulation of electron beams. Our results herald exciting prospects for microscopic material studies, enables electron lithography with fixed sample and beam and high resolution electronic chip inspection by structured electron illumination. - Highlights: • Nanoscale-patterned membranes are used to shape electron beams. • Designing on-axis phase plates outside the back focal plane is possible. • Computer-generated holograms enable nearly-arbitrary beam shaping. • Applications in microscopy, lithography, chip inspection and material sciences.

Dynamic nano-imaging of label-free living cells using electron beam excitation-assisted optical microscope

Science.gov (United States)

Fukuta, Masahiro; Kanamori, Satoshi; Furukawa, Taichi; Nawa, Yasunori; Inami, Wataru; Lin, Sheng; Kawata, Yoshimasa; Terakawa, Susumu

2015-01-01

Optical microscopes are effective tools for cellular function analysis because biological cells can be observed non-destructively and non-invasively in the living state in either water or atmosphere condition. Label-free optical imaging technique such as phase-contrast microscopy has been analysed many cellular functions, and it is essential technology for bioscience field. However, the diffraction limit of light makes it is difficult to image nano-structures in a label-free living cell, for example the endoplasmic reticulum, the Golgi body and the localization of proteins. Here we demonstrate the dynamic imaging of a label-free cell with high spatial resolution by using an electron beam excitation-assisted optical (EXA) microscope. We observed the dynamic movement of the nucleus and nano-scale granules in living cells with better than 100 nm spatial resolution and a signal-to-noise ratio (SNR) around 10. Our results contribute to the development of cellular function analysis and open up new bioscience applications. PMID:26525841

Dynamic nano-imaging of label-free living cells using electron beam excitation-assisted optical microscope.

Science.gov (United States)

Fukuta, Masahiro; Kanamori, Satoshi; Furukawa, Taichi; Nawa, Yasunori; Inami, Wataru; Lin, Sheng; Kawata, Yoshimasa; Terakawa, Susumu

2015-11-03

Optical microscopes are effective tools for cellular function analysis because biological cells can be observed non-destructively and non-invasively in the living state in either water or atmosphere condition. Label-free optical imaging technique such as phase-contrast microscopy has been analysed many cellular functions, and it is essential technology for bioscience field. However, the diffraction limit of light makes it is difficult to image nano-structures in a label-free living cell, for example the endoplasmic reticulum, the Golgi body and the localization of proteins. Here we demonstrate the dynamic imaging of a label-free cell with high spatial resolution by using an electron beam excitation-assisted optical (EXA) microscope. We observed the dynamic movement of the nucleus and nano-scale granules in living cells with better than 100 nm spatial resolution and a signal-to-noise ratio (SNR) around 10. Our results contribute to the development of cellular function analysis and open up new bioscience applications.

Development of full-field x-ray phase-tomographic microscope based on laboratory x-ray source

Science.gov (United States)

Takano, H.; Wu, Y.; Momose, A.

2017-09-01

An X-ray phase tomographic microscope that can quantitatively measure the refractive index of a sample in three dimensions with a high spatial resolution was developed by installing a Lau interferometer consisting of an absorption grating and a π/2 phase grating into the optics of an X-ray microscope. The optics comprises a Cu rotating anode X-ray source, capillary condenser optics, and a Fresnel zone plate for the objective. The microscope has two optical modes: a large-field-of-view mode (field of view: 65 μm x 65 μm) and a high-resolution mode (spatial resolution: 50 nm). Optimizing the parameters of the interferometer yields a self-image of the phase grating with 60% visibility. Through the normal fringe-scanning measurement, a twin phase image, which has an overlap of two phase image of opposite contrast with a shear distance much larger than system resolution, is generated. Although artifacts remain to some extent currently when a phase image is calculated from the twin phase image, this system can obtain high-spatial-resolution images resolving 50-nm structures. Phase tomography with this system has also been demonstrated using a phase object.

Imaging of surface plasmon polariton interference using phase-sensitive scanning tunneling microscope

NARCIS (Netherlands)

Jose, J.; Segerink, Franciscus B.; Korterik, Jeroen P.; Herek, Jennifer Lynn; Offerhaus, Herman L.

2011-01-01

We report the surface plasmon polariton interference, generated via a ‘buried’ gold grating, and imaged using a phase-sensitive Photon Scanning Tunneling Microscope (PSTM). The phase-resolved PSTM measurement unravels the complex surface plasmon polariton interference fields at the gold-air

Wave Optical Calculation of Probe Size in Low Energy Scanning Electron Microscope

Czech Academy of Sciences Publication Activity Database

Radlička, Tomáš

2015-01-01

Roč. 21, S4 (2015), s. 212-217 ISSN 1431-9276 R&D Projects: GA MŠk(CZ) LO1212 Institutional support: RVO:68081731 Keywords : scanning electron microscope * optical calculation Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering Impact factor: 1.730, year: 2015

Differential phase-contrast dark-field electron holography for strain mapping

Energy Technology Data Exchange (ETDEWEB)

Denneulin, Thibaud, E-mail: thibaud.denneulin@cemes.fr; Houdellier, Florent, E-mail: florent.houdellier@cemes.fr; Hÿtch, Martin, E-mail: martin.hytch@cemes.fr

2016-01-15

Strain mapping is an active area of research in transmission electron microscopy. Here we introduce a dark-field electron holographic technique that shares several aspects in common with both off-axis and in-line holography. Two incident and convergent plane waves are produced in front of the specimen thanks to an electrostatic biprism in the condenser system of a transmission electron microscope. The interference of electron beams diffracted by the illuminated crystal is then recorded in a defocused plane. The differential phase recovered from the hologram is directly proportional to the strain in the sample. The strain can be quantified if the separation of the images due to the defocus is precisely determined. The present technique has the advantage that the derivative of the phase is measured directly which allows us to avoid numerical differentiation. The distribution of the noise in the reconstructed strain maps is isotropic and more homogeneous. This technique was used to investigate different samples: a Si/SiGe superlattice, transistors with SiGe source/drain and epitaxial PZT thin films. - Highlights: • DPC dark-field electron holography is set up with a condenser biprism. • The DPC phase is directly proportional to the lattice deformation. • The technique is illustrated with epitaxial SiGe and Pb(Zr,Ti)O{sub 3} samples. • The defocus allows us to control the strain sensitivity and the spatial resolution. • A solution is proposed to setup this technique with a post-specimen biprism.

The Physical Characterization of Liposome Salicylic Acid Using Transmission Electron Microscope

International Nuclear Information System (INIS)

Elman Panjaitan

2008-01-01

The physical characterization of liposome, formulated from salicylic acid using thin film hydration methods with cholesterol and soybean lecithin, has been done. The formula was characterized by optical microscopes and Transmission Electron Microscope (TEM). The observation result shows that the salicylic acid can be formulated to liposomes. Soybean lecithin combined with cholesterol (600 mg : 20 mg) was the best formula and the liposome was spherical vesicle like with dimension about 70 nm unit 800 nm. (author)

Spinning Carbon Nanotube Nanothread under a Scanning Electron Microscope

Directory of Open Access Journals (Sweden)

Mark Schulz

2011-08-01

Full Text Available Nanothread with a diameter as small as one hundred nanometers was manufactured under a scanning electron microscope. Made directly from carbon nanotubes, and inheriting their superior electrical and mechanical properties, nanothread may be the world’s smallest man-made fiber. The smallest thread that can be spun using a bench-top spinning machine is about 5 microns in diameter. Nanothread is a new material building block that can be used at the nanoscale or plied to form yarn for applications at the micro and macro scales. Preliminary electrical and mechanical properties of nanothread were measured. The resistivity of nanothread is less than 10−5 Ω∙m. The strength of nanothread is greater than 0.5 GPa. This strength was obtained from measurements using special glue that cures in an electron microscope. The glue weakened the thread, thus further work is needed to obtain more accurate measurements. Nanothread will have broad applications in enabling electrical components, circuits, sensors, and tiny machines. Yarn can be used for various macroscale applications including lightweight antennas, composites, and cables.

Dynamic Low-Vacuum Scanning Electron Microscope Freeze Drying Observation for Fresh Water Algae

International Nuclear Information System (INIS)

Mohsen, H.T.; Ghaly, W.A.; Zahran, N.F.; Helal, A.I.

2010-01-01

A new perpetration method for serving in dynamic examinations of the fresh water algae is developed in connection with the Low-Vacuum Scanning Electron Microscope (LV-SEM) freeze drying technique. Specimens are collected from fresh water of Ismailia channel then transferred directly to freeze by liquid nitrogen and dried in the chamber of the scanning electron microscope in the low vacuum mode. Scanning electron micrographs revealed that the drying method presented the microstructure of algae. Dehydration in a graded ethanol series is not necessary in the new method. Dried algae specimen is observed in SEM high vacuum mode after conductive coating at higher resolution. Low-vacuum SEM freeze drying technique is a simple, time-saving and reproducible method for scanning electron microscopy that is applicable to various aquatic microorganisms covered with soft tissues.

Visualizing Morphological Changes of Abscission Zone Cells in Arabidopsis by Scanning Electron Microscope.

Science.gov (United States)

Shi, Chun-Lin; Butenko, Melinka A

2018-01-01

Scanning electron microscope (SEM) is a type of electron microscope which produces detailed images of surface structures. It has been widely used in plants and animals to study cellular structures. Here, we describe a detailed protocol to prepare samples of floral abscission zones (AZs) for SEM, as well as further image analysis. We show that it is a powerful tool to detect morphologic changes at the cellular level during the course of abscission in wild-type plants and to establish the details of phenotypic alteration in abscission mutants.

iSpectra: An Open Source Toolbox For The Analysis of Spectral Images Recorded on Scanning Electron Microscopes.

Science.gov (United States)

Liebske, Christian

2015-08-01

iSpectra is an open source and system-independent toolbox for the analysis of spectral images (SIs) recorded on energy-dispersive spectroscopy (EDS) systems attached to scanning electron microscopes (SEMs). The aim of iSpectra is to assign pixels with similar spectral content to phases, accompanied by cumulative phase spectra with superior counting statistics for quantification. Pixel-to-phase assignment starts with a threshold-based pre-sorting of spectra to create groups of pixels with identical elemental budgets, similar to a method described by van Hoek (2014). Subsequent merging of groups and re-assignments of pixels using elemental or principle component histogram plots enables the user to generate chemically and texturally plausible phase maps. A variety of standard image processing algorithms can be applied to groups of pixels to optimize pixel-to-phase assignments, such as morphology operations to account for overlapping excitation volumes over pixels located at phase boundaries. iSpectra supports batch processing and allows pixel-to-phase assignments to be applied to an unlimited amount of SIs, thus enabling phase mapping of large area samples like petrographic thin sections.

Optical and mechanical design for 1 nm resolution Auger spectroscopy in an electron microscope

International Nuclear Information System (INIS)

Bleeker, A.J.

1991-01-01

Detailed information about the atomic structure of surfaces and interfaces is vital for the progress in materials science and physics. One widely used surface sensitive technique is Auger spectroscopy (AS). This technique, in which the electron energy spectrum emerging from the sample is evaluated, gives information about the average elemental composition of the surface over a relative large surface area (>30nm). Electron microscopy (EM), on the other hand, is capable of producing surface structural, but no elemental, information with almost atomic resolution. EM and AS techniques have not been combined so far because of the different nature of the instrumentation used in both techniques. In AS instruments the sample is placed in an Ultra High Vacuum (UHV) system with a relatively large open space around the sample. In EM the sample is situated in the tight volume between the magnetic polepieces of the probe forming objective lens. The space around the sample is therefore tight. Furthermore the vacuum in most electron microscopes is not in UHV range. Radical mechanical changes to improve the vacuum are necessary to do AS in an electron microscope. Since the sample is immersed in the strong magnetic field of the objective lens the Auger electrons can not be extracted with conventional electrostatical methods. The only possibility to extract the Auger electrons is through the upper bore of the objective lens. However, this has large implications on the optical system of the microscope and requires a thorough investigation of the extraction of the Auger electrons. In this work it will be discussed how the surface sensitive AS can be combined with the high spatial resolution of the electron microscope in a practical instrument. (author). 102 refs.; 81 figs.; 4 tabs

Analysis of improvement in performance and design parameters for enhancing resolution in an atmospheric scanning electron microscope.

Science.gov (United States)

Yoon, Yeo Hun; Kim, Seung Jae; Kim, Dong Hwan

2015-12-01

The scanning electron microscope is used in various fields to go beyond diffraction limits of the optical microscope. However, the electron pathway should be conducted in a vacuum so as not to scatter electrons. The pretreatment of the sample is needed for use in the vacuum. To directly observe large and fully hydrophilic samples without pretreatment, the atmospheric scanning electron microscope (ASEM) is needed. We developed an electron filter unit and an electron detector unit for implementation of the ASEM. The key of the electron filter unit is that electrons are transmitted while air molecules remain untransmitted through the unit. The electron detector unit collected the backscattered electrons. We conducted experiments using the selected materials with Havar foil, carbon film and SiN film. © The Author 2015. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oup.com.

Electron microscope studies on nuclear track filters

International Nuclear Information System (INIS)

Roell, I.; Siegmon, W.

1982-01-01

Nuclear track filters became more and more important in various fields of application. The filtration process can be described by a set of suitable parameters. For some applications it may be necessary to know the structure of the surface and the pores themselves. In most cases the etching process yields surfaces and pore geometries that are quite different from ideal planes and cylinders. In the presented work the production of different filter types will be described. The resulting surfaces and pore structures have been investigated by means of a scanning electron microscope. (author)

Study of skin of an Egyptian mummy using a scanning electron microscope

Directory of Open Access Journals (Sweden)

Mańkowska-Pliszka Hanna

2017-06-01

Full Text Available The first study of modified human remains using an electron microscope was carried out at the end of the 1950 and in 1979 the first result of the study involving a scanning electron microscope (SEM was published for the first time. The study was mainly focused on the structure of tissues and cells. With the help of this technique cell and tissue elements, viruses and bacterial endospores as well as the structure of epithelium and the collagen contents of dermis were identified and described. In the above-mentioned case the object of the study using a SEM was a free part of the right hand (forearm with the dorsal and palmar parts of hand of unknown origin, with signs of mummification revealed during microscopic analysis. Our study was aimed at finding the answer to the question if the mummification of the studied limb was natural or intentional, and if the study using a SEM could link the anonymous remains with ancient Egypt.

Performance of ultrahigh resolution electron microscope JEM-4000EX and some applications of high Tc superconductors

International Nuclear Information System (INIS)

Honda, T.; Ibe, K.; Ishida, Y.; Kersker, M.M.

1989-01-01

The high resolution electron microscope is powerful for modern materials science because of its direct observation capability for the atomic structure of materials. the JEM-4000EX, a 400 kV accelerating voltage electron microscope whose objective lens has a 1 mm spherical aberration coefficient, has a 0.168 nm theoretical resolving power. Using this microscope, atomic structure images of high Tc superconductor such as Y-Ba-Cu-O, Bi-Ca-Sr-Cu-O and Tl-Ca-Ba-Cu-O are reported

Digital acquisition and processing of electron micrographs using a scanning transmission electron microscope

International Nuclear Information System (INIS)

Engel, A.; Christen, F.; Michel, B.

1981-01-01

A digital acquisition system that collects multichannel information from a scanning transmission electron microscope (STEM) and its application are described. The hardware comprises (i) single electron counting detectors, (ii) a digital scan generator, (iii) a digital multi-channel on-line processor, (iv) an interface to a minicomputer, and (v) a display system. Experimental results characterizing these components are presented, and their performance is discussed. The software includes assembler coded programs for dynamic file maintenance and fast acquisition of image data, a display driver, and FORTRAN coded application programs. The usefulness of digitized STEM is illustrated by a variety of biological applications. (orig.)

Scanning Electron Microscopic Studies of Microwave Sintered Al-SiC Nanocomposites and Their Properties

Directory of Open Access Journals (Sweden)

M. A. Himyan

2018-01-01

Full Text Available Al-metal matrix composites (AMMCs reinforced with diverse volume fraction of SiC nanoparticles were synthesized using microwave sintering process. The effects of the reinforcing SiC particles on physical, microstructure, mechanical, and electrical properties were studied. The phase, microstructural, and surface analyses of the composites were systematically conducted using X-ray diffraction (XRD, scanning electron microscope (SEM, and surface profilometer techniques, respectively. The microstructural examination revealed the homogeneous distribution of SiC particles in the Al matrix. Microhardness and compressive strength of nanocomposites were found to be increasing with the increasing volume fraction of SiC particles. Electrical conductivity of the nanocomposites decreases with increasing the SiC content.

Secondary mineralization in carious lesions of human dentin. Electron-probe, electron microscope, and electron diffraction studies

Energy Technology Data Exchange (ETDEWEB)

Ogiwara, H [Tokyo Dental Coll. (Japan)

1975-02-01

Dentinal carious lesions having a remineralized surface layer were studied by means electron-probe microanalysis, electron microscopy, electron diffraction. As the results of electron-probe study, F, Mg, and Na were found to be distributed mainly in the remineralized surface layer and S in the decalcified region where decreases in Ca, P, and Mg concentration were usually observed. The decrease in Mg concentration always started earlier than that of Ca and P concentration. Electron microscope and electron diffraction studies revealed that apatic crystals in the remineralized surface layer were much larger than those in the intact dentin. Although they were less conspicuous, crystals in the decalcified region also were larger than those in the intact region. Dentinal tubules, occluded by many crystals, were frequently seen during the observations. Crystals in the tubules varied in morphology, showing granular, needle, rhomboid, and tabular shapes. By means of electron diffraction, the granular- or needle-shaped crystals were identified as apatite and the rhomboid-shaped crystals as whitlockite. Some of the tabular-shaped crystals appeared to be cotacalcium phosphate.

Progress in element analysis on a high-voltage electron microscope

International Nuclear Information System (INIS)

Tivol, W.F.; Barnard, D.; Guha, T.

1985-01-01

X-Ray microprobe (XMA) and electron energy-loss (EELS) spectrometers have been installed on the high-voltage electron microscope (HVEM). The probe size has been measured and background reduction is in progress for XMA and EELS as are improvements in electron optics for EELS and sensitivity measurements. XMA is currently useful for qualitative analysis and has been used by several investigators from our laboratory and outside laboratories. However, EELS background levels are still too high for meaningful results to be obtained. Standards suitable for biological specimens are being measured, and a library for quantitative analysis is being compiled

Three-dimensional nanofabrication by electron-beam-induced deposition using 200-keV electrons in scanning transmission electron microscope

International Nuclear Information System (INIS)

Liu, Z.Q.; Mitsuishi, K.; Furuya, K.

2005-01-01

Attempts were made to fabricate three-dimensional nanostructures on and out of a substrate by electron-beam-induced deposition in a 200-kV scanning transmission electron microscope. Structures with parallel wires over the substrate surface were difficult to fabricate due to the direct deposition of wires on both top and bottom surfaces of the substrate. Within the penetration depth of the incident electron beam, nanotweezers were fabricated by moving the electron beam beyond different substrate layers. Combining the deposition of self-supporting wires and self-standing tips, complicated three-dimensional doll-like, flag-like, and gate-like nanostructures that extend out of the substrate were successfully fabricated with one-step or multi-step scans of the electron beam. Effects of coarsening, nucleation, and distortion during electron-beam-induced deposition are discussed. (orig.)

The sinusoidal lining cells in "normal" human liver. A scanning electron microscopic investigation

DEFF Research Database (Denmark)

Horn, T; Henriksen, Jens Henrik Sahl; Christoffersen, P

1986-01-01

The scanning electron microscopic was used to study the fenestrations of human liver sinusoids. Thirteen biopsies, where light microscopy and transmission electron microscopy revealed normal sinusoidal architecture, were investigated. The number of fenestrae was calculated in acinar zone 3...

Development of Scanning-Imaging X-Ray Microscope for Quantitative Three-Dimensional Phase Contrast Microimaging

International Nuclear Information System (INIS)

Takeuchi, Akihisa; Suzuki, Yoshio; Uesugi, Kentaro

2013-01-01

A novel x-ray microscope system has been developed for the purpose of quantitative and sensitive three-dimensional (3D) phase-contrast x-ray microimaging. The optical system is a hybrid that consists of a scanning microscope optics with a one-dimensional (1D) focusing (line-focusing) device and an imaging microscope optics with a 1D objective. These two optics are orthogonally arranged regarding their common optical axis. Each is used for forming each dimension of two-dimensional (2D) image. The same data acquisition process as that of the scanning microscope system enables quantitative and sensitive x-ray imaging such as phase contrast and absorption contrast. Because a 2D image is measured with only 1D translation scan, much shorter measurement time than that of conventional scanning optics has been realized. By combining a computed tomography (CT) technique, some 3D CT application examples are demonstrated

Helium leak testing of scanning electron microscope

International Nuclear Information System (INIS)

Ahmad, Anis; Tripathi, S.K.; Mukherjee, D.

2015-01-01

Scanning Electron Microscope (SEM) is a specialized electron-optical device which is used for imaging of miniscule features on topography of material specimens. Conventional SEMs used finely focused high energy (about 30 KeV) electron beam probes of diameter of about 10nm for imaging of solid conducting specimens. Vacuum of the order of 10"-"5 Torr is prerequisite for conventional Tungsten filament type SEMs. One such SEM was received from one of our laboratory in BARC with a major leak owing to persisting poor vacuum condition despite continuous pumping for several hours. He-Leak Detection of the SEM was carried out at AFD using vacuum spray Technique and various potential leak joints numbering more than fifty were helium leak tested. The major leak was detected in the TMP damper bellow. The part was later replaced and the repeat helium leak testing of the system was carried out using vacuum spray technique. The vacuum in SEM is achieved is better than 10"-"5 torr and system is now working satisfactorily. (author)

Development of a SEM-based low-energy in-line electron holography microscope for individual particle imaging.

Science.gov (United States)

Adaniya, Hidehito; Cheung, Martin; Cassidy, Cathal; Yamashita, Masao; Shintake, Tsumoru

2018-05-01

A new SEM-based in-line electron holography microscope has been under development. The microscope utilizes conventional SEM and BF-STEM functionality to allow for rapid searching of the specimen of interest, seamless interchange between SEM, BF-STEM and holographic imaging modes, and makes use of coherent low-energy in-line electron holography to obtain low-dose, high-contrast images of light element materials. We report here an overview of the instrumentation and first experimental results on gold nano-particles and carbon nano-fibers for system performance tests. Reconstructed images obtained from the holographic imaging mode of the new microscope show substantial image contrast and resolution compared to those acquired by SEM and BF-STEM modes, demonstrating the feasibility of high-contrast imaging via low-energy in-line electron holography. The prospect of utilizing the new microscope to image purified biological specimens at the individual particle level is discussed and electron optical issues and challenges to further improve resolution and contrast are considered. Copyright © 2018 Elsevier B.V. All rights reserved.

Decontamination of digital image sensors and assessment of electron microscope performance in a BSL-3 containment

Directory of Open Access Journals (Sweden)

Michael B. Sherman

2015-05-01

Full Text Available A unique biological safety level (BSL-3 cryo-electron microscopy facility with a 200 keV high-end cryo-electron microscope has been commissioned at the University of Texas Medical Branch (UTMB to study the structure of viruses and bacteria classified as select agents. We developed a microscope decontamination protocol based on chlorine dioxide gas with a continuous flow system. In this paper we report on testing digital camera sensors (both CCD and CMOS direct detector in a BSL-3 environment, and microscope performance after chlorine dioxide (ClO2 decontamination cycles.

Correlation between mechanical vibrations and resolving power of an electron microscope

International Nuclear Information System (INIS)

Lopez, J.J.

1975-01-01

The mechanical vibrations of the Grenoble 1MV electron microscope are analyzed. The solutions used to obtain a stability in the order of 3.10 -6 are exposed. A resolution of 1,8A should be achieved [fr

Record number (11 000) of interference fringes obtained by a 1 MV field-emission electron microscope

International Nuclear Information System (INIS)

Akashi, Tetsuya; Harada, Ken; Matsuda, Tsuyoshi; Kasai, Hiroto; Tonomura, Akira; Furutsu, Tadao; Moriya, Noboru; Yoshida, Takaho; Kawasaki, Takeshi; Kitazawa, Koichi; Koinuma, Hideomi

2002-01-01

An electron biprism for a 1 million-volt field-emission electron microscope was developed. This biprism is controlled similarly as a specimen holder so that it can be driven and rotated precisely and is tough against mechanical vibration and stray magnetic field. We recorded the maximum number of interference fringes by using this biprism in order to confirm the overall performance as a holography electron microscope, and obtained a world record of 11,000 interference fringes

Electric field stimulation setup for photoemission electron microscopes.

Science.gov (United States)

Buzzi, M; Vaz, C A F; Raabe, J; Nolting, F

2015-08-01

Manipulating magnetisation by the application of an electric field in magnetoelectric multiferroics represents a timely issue due to the potential applications in low power electronics and the novel physics involved. Thanks to its element sensitivity and high spatial resolution, X-ray photoemission electron microscopy is a uniquely suited technique for the investigation of magnetoelectric coupling in multiferroic materials. In this work, we present a setup that allows for the application of in situ electric and magnetic fields while the sample is analysed in the microscope. As an example of the performances of the setup, we present measurements on Ni/Pb(Mg(0.66)Nb(0.33))O3-PbTiO3 and La(0.7)Sr(0.3)MnO3/PMN-PT artificial multiferroic nanostructures.

Influence of electron beam exposure on crystallization of phase-change materials

NARCIS (Netherlands)

Pandian, Ramanathaswamy; Kooi, Bart J.; De Hosson, Jeff Th. M.; Pauza, Andrew

2007-01-01

Isothermal crystallization of amorphous SbxTe films capped with ZnS-SiO2 or GeCrN layers was performed using in situ heating within a transmission electron microscope. The effect of the electron beam of the microscope on the crystallization process was investigated. It was found that electron

Differential phase microscope and micro-tomography with a Foucault knife-edge scanning filter

Science.gov (United States)

Watanabe, N.; Hashizume, J.; Goto, M.; Yamaguchi, M.; Tsujimura, T.; Aoki, S.

2013-10-01

An x-ray differential phase microscope with a Foucault knife-edge scanning filter was set up at the bending magnet source BL3C, Photon Factory. A reconstructed phase profile from the differential phase image of an aluminium wire at 5.36 keV was fairly good agreement with the numerical simulation. Phase tomography of a biological specimen, such as an Artemia cyst, could be successfully demonstrated.

Construction of a four tip scanning tunneling microscope/scanning electron microscope combination and conductivity measurements of silicide nanowires

International Nuclear Information System (INIS)

Zubkov, Evgeniy

2013-01-01

In this work the combination of a four-tip scanning tunneling microscope with a scanning electron microscope is presented. By means of this apparatus it is possible to perform the conductivity measurements on the in-situ prepared nanostructures in ultra-high vacuum. With the aid of a scanning electron microscope (SEM), it becomes possible to position the tunneling tips of the four-tip scanning tunneling microscope (STM), so that an arrangement for a four-point probe measurement on nanostructures can be obtained. The STM head was built according to the novel coaxial Beetle concept. This concept allows on the one hand, a very compact arrangement of the components of the STM and on the other hand, the new-built STM head has a good mechanical stability, in order to achieve atomic resolution with all four STM units. The atomic resolution of the STM units was confirmed by scanning a Si(111)-7 x 7 surface. The thermal drift during the STM operation, as well as the resonant frequencies of the mechanical structure of the STM head, were determined. The scanning electron microscope allows the precise and safe navigation of the tunneling tips on the sample surface. Multi tip spectroscopy with up to four STM units can be performed synchronously. To demonstrate the capabilities of the new-built apparatus the conductivity measurements were carried out on metallic yttrium silicide nanowires. The nanowires were prepared by the in-situ deposition of yttrium on a heated Si(110) sample surface. Current-voltage curves were recorded on the nanowires and on the wetting layer in-between. The curves indicate an existence of the Schottky barrier between the yttrium silicide nanowires and the silicon bulk. By means of the two-tip measurements with a gate, the insulating property of the Schottky barrier has been confirmed. Using this Schottky barrier, it is possible to limit the current to the nanowire and to prevent it from flowing through the silicon bulk. A four-tip resistance measurement

Characterization of quantum well structures using a photocathode electron microscope

Science.gov (United States)

Spencer, Michael G.; Scott, Craig J.

1989-01-01

Present day integrated circuits pose a challenge to conventional electronic and mechanical test methods. Feature sizes in the submicron and nanometric regime require radical approaches in order to facilitate electrical contact to circuits and devices being tested. In addition, microwave operating frequencies require careful attention to distributed effects when considering the electrical signal paths within and external to the device under test. An alternative testing approach which combines the best of electrical and optical time domain testing is presented, namely photocathode electron microscope quantitative voltage contrast (PEMQVC).

Improved coating and fixation methods for scanning electron microscope autoradiography

International Nuclear Information System (INIS)

Weiss, R.L.

1984-01-01

A simple apparatus for emulsion coating is described. The apparatus is inexpensive and easily assembled in a standard glass shop. Emulsion coating for scanning electron microscope autoradiography with this apparatus consistently yields uniform layers. When used in conjunction with newly described fixation methods, this new approach produces reliable autoradiographs of undamaged specimens

A video-amplifier device for the transmission-type electron microscope ELMISCOP I of Siemens

International Nuclear Information System (INIS)

Groboth, G.; Hoerl, E.M.

1975-01-01

In order to get a visual image of the sample at the final screen of a transmission-type electron microscope and to keep at the same time the sample at low temperature a video-amplifier device has been developed by the authors. Details about its design and the necessary reconstruction of the electron microscope equipment are given. The beam current density at the transparent screen is reduced to 10 -12 -10 -13 A.cm -2 . Moreover the costs of this video-amplifier device are lower than those available. (CR)

Use of high voltage electron microscope to simulate radiation damage by neutrons

International Nuclear Information System (INIS)

Mayer, R.M.

1976-01-01

The use of the high voltage electron microscope to simulate radiation damage by neutrons is briefly reviewed. This information is important in explaining how alloying affects void formation during neutron irradiation

Imaging single atoms using secondary electrons with an aberration-corrected electron microscope.

Science.gov (United States)

Zhu, Y; Inada, H; Nakamura, K; Wall, J

2009-10-01

Aberration correction has embarked on a new frontier in electron microscopy by overcoming the limitations of conventional round lenses, providing sub-angstrom-sized probes. However, improvement of spatial resolution using aberration correction so far has been limited to the use of transmitted electrons both in scanning and stationary mode, with an improvement of 20-40% (refs 3-8). In contrast, advances in the spatial resolution of scanning electron microscopes (SEMs), which are by far the most widely used instrument for surface imaging at the micrometre-nanometre scale, have been stagnant, despite several recent efforts. Here, we report a new SEM, with aberration correction, able to image single atoms by detecting electrons emerging from its surface as a result of interaction with the small probe. The spatial resolution achieved represents a fourfold improvement over the best-reported resolution in any SEM (refs 10-12). Furthermore, we can simultaneously probe the sample through its entire thickness with transmitted electrons. This ability is significant because it permits the selective visualization of bulk atoms and surface ones, beyond a traditional two-dimensional projection in transmission electron microscopy. It has the potential to revolutionize the field of microscopy and imaging, thereby opening the door to a wide range of applications, especially when combined with simultaneous nanoprobe spectroscopy.

Modeling secondary electron emission from nanostructured materials in helium ion microscope

International Nuclear Information System (INIS)

Ohya, K.; Yamanaka, T.

2013-01-01

Charging of a SiO 2 layer on a Si substrate during helium (He) beam irradiation is investigated at an energy range relevant to a He ion microscope (HIM). A self-consistent calculation is performed to model the transport of the ions and secondary electrons (SEs), the charge accumulation in the layer, and the electric field below and above the surface. The calculated results are compared with those for gallium (Ga) ions at the same energy and 1 keV electrons corresponding to a low-voltage scanning electron microscope (SEM). The charging of thin layers ( 2 step formed on a Si substrate, a sharp increase in the number of SEs is observed, irrespective of whether a material is charged or not. When the He ions are incident on the bottom of the step, the re-entrance of SEs emitted from the substrate into the sidewall is clearly observed, but it causes the sidewall to be charged negatively. At the positions on the SiO 2 layer away from the step edge, the charging voltage becomes positive with increasing number of Ga ions and electrons. However, He ions do not induce such a voltage due to strong relaxation of positive and negative charges in the Si substrate and their recombination in the SiO 2 layer

Three-dimensional phase-contrast X-ray microtomography with scanning–imaging X-ray microscope optics

International Nuclear Information System (INIS)

Takeuchi, Akihisa; Uesugi, Kentaro; Suzuki, Yoshio

2013-01-01

A novel three-dimensional X-ray microtomographic micro-imaging system which enables simultaneous measurement of differential phase contrast and absorption contrast has been developed. The optical system consists of a scanning microscope with one-dimensional focusing device and an imaging microscope with one-dimensional objective. A three-dimensional (3D) X-ray tomographic micro-imaging system has been developed. The optical system is based on a scanning–imaging X-ray microscope (SIXM) optics, which is a hybrid system consisting of a scanning microscope optics with a one-dimensional (1D) focusing (line-focusing) device and an imaging microscope optics with a 1D objective. In the SIXM system, each 1D dataset of a two-dimensional (2D) image is recorded independently. An object is illuminated with a line-focused beam. Positional information of the region illuminated by the line-focused beam is recorded with the 1D imaging microscope optics as line-profile data. By scanning the object with the line focus, 2D image data are obtained. In the same manner as for a scanning microscope optics with a multi-pixel detector, imaging modes such as phase contrast and absorption contrast can be arbitrarily configured after the image data acquisition. By combining a tomographic scan method and the SIXM system, quantitative 3D imaging is performed. Results of a feasibility study of the SIXM for 3D imaging are shown

In situ laser processing in a scanning electron microscope

Energy Technology Data Exchange (ETDEWEB)

Roberts, Nicholas A.; Magel, Gregory A.; Hartfield, Cheryl D.; Moore, Thomas M.; Fowlkes, Jason D.; Rack, Philip D. [Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996 (United States) and Omniprobe, Inc., an Oxford Instruments Company, 10410 Miller Rd., Dallas, Texas 75238 (United States); Omniprobe, Inc., an Oxford Instruments Company, 10410 Miller Rd., Dallas, Texas 75238 (United States); Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States); Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996 (United States) and Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States)

2012-07-15

Laser delivery probes using multimode fiber optic delivery and bulk focusing optics have been constructed and used for performing materials processing experiments within scanning electron microscope/focused ion beam instruments. Controlling the current driving a 915-nm semiconductor diode laser module enables continuous or pulsed operation down to sub-microsecond durations, and with spot sizes on the order of 50 {mu}m diameter, achieving irradiances at a sample surface exceeding 1 MW/cm{sup 2}. Localized laser heating has been used to demonstrate laser chemical vapor deposition of Pt, surface melting of silicon, enhanced purity, and resistivity via laser annealing of Au deposits formed by electron beam induced deposition, and in situ secondary electron imaging of laser induced dewetting of Au metal films on SiO{sub x}.

3D geometric phase analysis and its application in 3D microscopic morphology measurement

Science.gov (United States)

Zhu, Ronghua; Shi, Wenxiong; Cao, Quankun; Liu, Zhanwei; Guo, Baoqiao; Xie, Huimin

2018-04-01

Although three-dimensional (3D) morphology measurement has been widely applied on the macro-scale, there is still a lack of 3D measurement technology on the microscopic scale. In this paper, a microscopic 3D measurement technique based on the 3D-geometric phase analysis (GPA) method is proposed. In this method, with machine vision and phase matching, the traditional GPA method is extended to three dimensions. Using this method, 3D deformation measurement on the micro-scale can be realized using a light microscope. Simulation experiments were conducted in this study, and the results demonstrate that the proposed method has a good anti-noise ability. In addition, the 3D morphology of the necking zone in a tensile specimen was measured, and the results demonstrate that this method is feasible.

Facilities for in situ ion beam studies in transmission electron microscopes

International Nuclear Information System (INIS)

Allen, C.W.; Ohnuki, S.; Takahashi, H.

1993-08-01

Interfacing an ion accelerator to a transmission electron microscope (TEM) allows the analytical functions of TEM imaging and electron diffraction from very small regions to be employed during ion-irradiation effects studies. At present there are ten such installations in Japan, one in France and one in the USA. General specifications of facilities which are operational in 1993 are summarized, and additional facilities which are planned or being proposed are briefly described

Observation of superconducting fluxons by transmission electron microscopy: A Fourier space approach to calculate the electron optical phase shifts and images

International Nuclear Information System (INIS)

Beleggia, M.; Pozzi, G.

2001-01-01

An approach is presented for the calculation of the electron optical phase shift experienced by high-energy electrons in a transmission electron microscope, when they interact with the magnetic field associated with superconducting fluxons in a thin specimen tilted with respect to the beam. It is shown that by decomposing the vector potential in its Fourier components and by calculating the phase shift of each component separately, it is possible to obtain the Fourier transform of the electron optical phase shift, which can be inverted either analytically or numerically. It will be shown how this method can be used to recover the result, previously obtained by the real-space approach, relative to the case of a straight flux tube perpendicular to the specimen surfaces. Then the method is applied to the case of a London fluxon in a thin film, where the bending and the broadening of the magnetic-field lines due to the finite specimen thickness are now correctly taken into account and not treated approximately by means of a parabolic fit. Finally, it will be shown how simple models for the pancake structure of the fluxon can be analyzed within this framework and the main features of electron transmission images predicted

Quantitative phase tomography by using x-ray microscope with Foucault knife-edge scanning filter

Energy Technology Data Exchange (ETDEWEB)

Watanabe, Norio; Tsuburaya, Yuji; Shimada, Akihiro; Aoki, Sadao [Faculty of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Ibaraki, 305-8573 (Japan)

2016-01-28

Quantitative phase tomography was evaluated by using a differential phase microscope with a Foucault knife-edge scanning filter. A 3D x-ray phase image of polystyrene beads was obtained at 5.4 keV. The reconstructed refractive index was fairly good agreement with the Henke’s tabulated data.

Quantitative phase tomography by using x-ray microscope with Foucault knife-edge scanning filter

International Nuclear Information System (INIS)

Watanabe, Norio; Tsuburaya, Yuji; Shimada, Akihiro; Aoki, Sadao

2016-01-01

Quantitative phase tomography was evaluated by using a differential phase microscope with a Foucault knife-edge scanning filter. A 3D x-ray phase image of polystyrene beads was obtained at 5.4 keV. The reconstructed refractive index was fairly good agreement with the Henke’s tabulated data

Quantitative phase tomography by using x-ray microscope with Foucault knife-edge scanning filter

Science.gov (United States)

Watanabe, Norio; Tsuburaya, Yuji; Shimada, Akihiro; Aoki, Sadao

2016-01-01

Quantitative phase tomography was evaluated by using a differential phase microscope with a Foucault knife-edge scanning filter. A 3D x-ray phase image of polystyrene beads was obtained at 5.4 keV. The reconstructed refractive index was fairly good agreement with the Henke's tabulated data.

Reversibility of magnetic field driven transition from electronic phase separation state to single-phase state in manganites: A microscopic view

Science.gov (United States)

Liu, Hao; Lin, Lingfang; Yu, Yang; Lin, Hanxuan; Zhu, Yinyan; Miao, Tian; Bai, Yu; Shi, Qian; Cai, Peng; Kou, Yunfang; Lan, Fanli; Wang, Wenbin; Zhou, Xiaodong; Dong, Shuai; Yin, Lifeng; Shen, Jian

2017-11-01

Electronic phase separation (EPS) is a common phenomenon in strongly correlated oxides. For colossal magnetoresistive (CMR) manganites, the EPS is so pronounced that not only does it govern the CMR behavior, but also raises a question whether EPS exists as a ground state for systems or a metastable state. While it has been well known that a magnetic field can drive the transition of the EPS state into a single-phase state in manganites, the reversibility of this transition is not well studied. In this work we use magnetic force microscopy (MFM) to directly visualize the reversibility of the field driven transition between the EPS state and the single-phase state at different temperatures. The MFM images correspond well with the global magnetic and transport property measurements, uncovering the underlying mechanism of the field driven transition between the EPS state and the single-phase state. We argue that EPS state is a consequence of system quenching whose response to an external magnetic field is governed by a local energy landscape.

Electronic zooming TV readout system for an x-ray microscope

International Nuclear Information System (INIS)

Kinoshita, K.; Matsumura, T.; Inagaki, Y.; Hirai, N.; Sugiyama, M.; Kihara, H.; Watanabe, N.; Shimanuki, Y.

1993-01-01

The electronic zooming TV readout system using the X-ray zooming tube has been developed for purposes of real-time readout of very high resolution X-ray image, e.g. the output image from an X-ray microscope. The system limiting resolution is 0.2∼0.3 μm and it is easy to operate in practical applications

Electron microscope studies. Progress report, 1 July 1964--1 June 1992

Energy Technology Data Exchange (ETDEWEB)

Crewe, A.V.; Kapp, O.H.

1992-07-01

This is a report covering the research performed in the Crewe laboratory between 1964 and 1992. Because of limitations of space we have provided relatively brief summaries of the major research directions of the facility during these years. A complete bibliography has been included and we have referenced groups of pertinent publications at the beginning of each section. This report summarizes our efforts to develop better electron microscopes and chronicles many of the experimental programs, in materials science and biology, that acted both as a stimulus to better microscope design and also as a testing ground for many instrumental innovations.

Multi-technique application of a double reflection electron emission microscope

International Nuclear Information System (INIS)

Jian-liang, J.; Bao-gui, S.; Guo-jun, Z

2002-01-01

Full text: In this paper the results acquired with the most recently developed double reflection electron emission microscope applied in different imaging modes are presented. The novel illumination system is based on a (100)-oriented single crystalline W wire electron microreflector and an electron gun placed in the back focal plane of the immersion objective. After being elastically reflected from the W tip surface, the primary electrons of energy ranging from 1 to 6 keV are decelerated to the desired impact energy in the range 0 to 200 eV for mirror electron microscopy (MEM), low energy electron emission microscopy (LEEM) and low energy electron diffraction (LEED) modes or to 5 keV for the secondary electron imaging mode. Photoelectron emission microscopy (PEEM), MEM, LEEM, secondary images of Pd/Si(111) and a set of selected area LEED patterns of the W(100) surface taken at energies ranging from 5 to 40 eV are presented for the first time. Copyright (2002) Australian Society for Electron Microscopy Inc

Scanning electron microscopical examination of the impact of laser patterning on microscopic inhomogeneities of Cu(In,Ga)(Se,S)2 absorbers produced by rapid thermal processing

International Nuclear Information System (INIS)

Künecke, U.; Hölzing, A.; Jost, S.; Lechner, R.; Vogt, H.; Heiß, A.; Palm, J.; Hock, R.; Wellmann, P.

2013-01-01

Laser scribing of the Mo back electrode is commonly applied to define the cell structure of Cu(In,Ga)(Se,S) 2 (CIGSSe) thin film solar cells. The patterning process was performed on laboratory samples using ns and ps pulse length laser processes. After structuring, CIGSSe absorbers were processed by rapid thermal processing (RTP) of stacked elemental layer precursors. Microscopic inhomogeneities were investigated on different sample positions. For samples structured with ns pulse, the absorber morphology in the laser line vicinity is different as compared to the morphology in the unstructured cell area. Scanning electron microscopy and energy-dispersive X-ray spectroscopy show significant changes in the absorber grain size and chemical composition. Close to the laser line, the typically observed Ga accumulation on the back contact is less pronounced and more Ga is incorporated closer to the surface leading to a smaller grain size. The observed changes are attributed to partial damaging of a diffusion barrier between glass and Mo induced by the ns laser process, which allows diffusion of sodium from the glass substrate into the absorber during RTP. The enhanced Ga incorporation closer to the surface is an indication for the influence of sodium on the local phase development during RTP. The damages of the diffusion barrier can be effectively prevented by the application of a ps laser scribing process. CIGSSe absorbers processed on samples structured with ps pulse length do not show the described microscopic inhomogeneities around the laser line. - Highlights: ► Scanning electron microscopy on Cu(In,Ga)(Se,S) 2 solar cell absorbers ► Laser patterning with ns laser pulse damages the sodium diffusion barrier. ► Improved laser patterning with ps laser pulse leaves diffusion barrier intact. ► Additional sodium changes phase development during absorber formation. ► Gallium content is increased at surface and decreased at backside of absorber

Cathodoluminescence in the scanning transmission electron microscope

Energy Technology Data Exchange (ETDEWEB)

Kociak, M., E-mail: mathieu.kociak@u-psud.fr [Laboratoire de Physique des Solides, Université Paris-SudParis-Sud, CNRS-UMR 8502, Orsay 91405 (France); Zagonel, L.F. [“Gleb Wataghin” Institute of Physics University of Campinas - UNICAMP, 13083-859 Campinas, São Paulo (Brazil)

2017-05-15

Cathodoluminescence (CL) is a powerful tool for the investigation of optical properties of materials. In recent years, its combination with scanning transmission electron microscopy (STEM) has demonstrated great success in unveiling new physics in the field of plasmonics and quantum emitters. Most of these results were not imaginable even twenty years ago, due to conceptual and technical limitations. The purpose of this review is to present the recent advances that broke these limitations, and the new possibilities offered by the modern STEM-CL technique. We first introduce the different STEM-CL operating modes and the technical specificities in STEM-CL instrumentation. Two main classes of optical excitations, namely the coherent one (typically plasmons) and the incoherent one (typically light emission from quantum emitters) are investigated with STEM-CL. For these two main classes, we describe both the physics of light production under electron beam irradiation and the physical basis for interpreting STEM-CL experiments. We then compare STEM-CL with its better known sister techniques: scanning electron microscope CL, photoluminescence, and electron energy-loss spectroscopy. We finish by comprehensively reviewing recent STEM-CL applications. - Highlights: • Reviews the field of STEM-CL. • Introduces the technical requirements and challenges for STEM-CL. • Introduces the different types of excitations probed by STEM-CL. • Gives comprehensive overview of the last fifteenth years in the field.

Sb,123121 nuclear quadrupole resonance as a microscopic probe in the Te-doped correlated semimetal FeSb2: Emergence of electronic Griffith phase, magnetism, and metallic behavior

Science.gov (United States)

Gippius, A. A.; Zhurenko, S. V.; Hu, R.; Petrovic, C.; Baenitz, M.

2018-02-01

Sb,123121 nuclear quadrupole resonance (NQR) was applied to Fe(Sb1-xTex)2 in the low doping regime (x =0 , 0.01, and 0.05) as a microscopic zero field probe to study the evolution of 3 d magnetism and the emergence of metallic behavior. Whereas the NQR spectra itself reflects the degree of local disorder via the width of the individual NQR lines, the spin lattice relaxation rate (SLRR) 1 /T1(T ) probes the fluctuations at the Sb site. The fluctuations originate either from conduction electrons or from magnetic moments. In contrast to the semimetal FeSb2 with a clear signature of the charge and spin gap formation in 1 /T1(T ) T [˜exp/(Δ kBT ) ] , the 1% Te-doped system exhibits almost metallic conductivity and the SLRR nicely confirms that the gap is almost filled. A weak divergence of the SLRR coefficient 1 /T1(T ) T ˜T-n˜T-0.2 points towards the presence of electronic correlations towards low temperatures. This is supported by the electronic specific heat coefficient γ =(Cel/T ) showing a power-law divergence γ (T ) ˜T-m˜(1/T1T ) 1 /2˜T-n /2˜Cel/T which is expected in the renormalized Landau Fermi liquid theory for correlated electrons. In contrast to that the 5% Te-doped sample exhibits a much larger divergence in the SLRR coefficient showing 1 /T1(T ) T ˜T-0.72 . According to the specific heat divergence a power law with n =2 m =0.56 is expected for the SLRR. This dissimilarity originates from admixed critical magnetic fluctuations in the vicinity of antiferromagnetic long range order with 1 /T1(T ) T ˜T-3 /4 behavior. Furthermore Te-doped FeSb2 as a disordered paramagnetic metal might be a platform for the electronic Griffith phase scenario. NQR evidences a substantial asymmetric broadening of the Sb,123121 NQR spectrum for the 5% sample. This has a predominant electronic origin in agreement with the electronic Griffith phase and stems probably from an enhanced Sb-Te bond polarization and electronic density shift towards the Te atom inside Sb

Dose-rate-dependent damage of cerium dioxide in the scanning transmission electron microscope.

Science.gov (United States)

Johnston-Peck, Aaron C; DuChene, Joseph S; Roberts, Alan D; Wei, Wei David; Herzing, Andrew A

2016-11-01

Beam damage caused by energetic electrons in the transmission electron microscope is a fundamental constraint limiting the collection of artifact-free information. Through understanding the influence of the electron beam, experimental routines may be adjusted to improve the data collection process. Investigations of CeO 2 indicate that there is not a critical dose required for the accumulation of electron beam damage. Instead, measurements using annular dark field scanning transmission electron microscopy and electron energy loss spectroscopy demonstrate that the onset of measurable damage occurs when a critical dose rate is exceeded. The mechanism behind this phenomenon is that oxygen vacancies created by exposure to a 300keV electron beam are actively annihilated as the sample re-oxidizes in the microscope environment. As a result, only when the rate of vacancy creation exceeds the recovery rate will beam damage begin to accumulate. This observation suggests that dose-intensive experiments can be accomplished without disrupting the native structure of the sample when executed using dose rates below the appropriate threshold. Furthermore, the presence of an encapsulating carbonaceous layer inhibits processes that cause beam damage, markedly increasing the dose rate threshold for the accumulation of damage. Published by Elsevier B.V.

Laser-induced microscopic phase-transition on an ionic liquid

International Nuclear Information System (INIS)

Iguchi, Natsuki; Datta, Alokmay; Yoshikawa, Kenichi; Ma Yue

2009-01-01

Nematic-isotropic transition is induced in a 5 μm 'droplet' within an oriented bulk of a mixture of a liquid crystalline material with a room-temperature ionic liquid, by a laser working at 532 nm with an output power of 200 mW and a beam diameter of 1 μm. No microscopic phase transition is observed either in absence of the ionic liquid or at the other wavelength of 1064 nm, available to the Nd-YAG laser. This indicates the essential role on a resonant transfer of energy to the ionic liquid from the laser radiation, which is subsequently transferred to the liquid crystal. Spectroscopy of the pure liquid crystal and ionic liquid samples confirms this concept. Spatio-temporal image of the droplet growth shows, however, that the phase transition remains confined within the microscopic domain for the first 50 s, and then spreads out rapidly. Since resonant, quantum transitions between molecular levels takes place in less than microseconds, the about seven orders of magnitude slowing down of energy transfer observed here suggests unique hierarchical dynamics including the coupling between the intra-molecular motions in the ionic liquid and the inter-molecular forces between ionic liquid and liquid crystal.

A novel phase-sensitive scanning near-field optical microscope

International Nuclear Information System (INIS)

Wu Xiao-Yu; Lin Sun; Tan Qiao-Feng; Wang Jia

2015-01-01

Phase is one of the most important parameters of electromagnetic waves. It is the phase distribution that determines the propagation, reflection, refraction, focusing, divergence, and coupling features of light, and further affects the intensity distribution. In recent years, the designs of surface plasmon polariton (SPP) devices have mostly been based on the phase modulation and manipulation. Here we demonstrate a phase sensitive multi-parameter heterodyne scanning near-field optical microscope (SNOM) with an aperture probe in the visible range, with which the near field optical phase and amplitude distributions can be simultaneously obtained. A novel architecture combining a spatial optical path and a fiber optical path is employed for stability and flexibility. Two kinds of typical nano-photonic devices are tested with the system. With the phase-sensitive SNOM, the phase and amplitude distributions of any nano-optical field and localized field generated with any SPP nano-structures and irregular phase modulation surfaces can be investigated. The phase distribution and the interference pattern will help us to gain a better understanding of how light interacts with SPP structures and how SPP waves generate, localize, convert, and propagate on an SPP surface. This will be a significant guidance on SPP nano-structure design and optimization. (paper)

Study of microscopic phase separation in La2CuO4+y by μSR

International Nuclear Information System (INIS)

Pomyakushin, V.Yu.; Duginov, V.N.; Amato, A.; Gygax, F.N.; Schenck, A.; Herlach, D.

1996-01-01

Electron spin-freezing at T f =8K has been detected in superconducting (T c =12K) single crystal La 2 CuO 4+y (y≅0.03) by μSR. According to the diffraction data the crystal is in the Bmab phase and macroscopically homogeneous without any traces of structural phase separation. At T f part of crystal enters spin-glass-like state, and at T=3K the 'frozen' fraction amounts about half of the crystal volume. μSR-experiment in the external magnetic field has shown that no Abrikosov flux line lattice is formed below T c . The obtained data allow to assume that magnetic and superconducting regions in the crystal are space separated on the microscopic scales ∼10 2 A. Large (>1000ppm) external field induced broadening of the Knight shift distribution on the muon found at all temperatures T ∼ <130K indicates that the crystal contains micro-regions possessing enhanced magnetic susceptibility. 31 refs., 13 figs

Femtosecond photoelectron point projection microscope

International Nuclear Information System (INIS)

Quinonez, Erik; Handali, Jonathan; Barwick, Brett

2013-01-01

By utilizing a nanometer ultrafast electron source in a point projection microscope we demonstrate that images of nanoparticles with spatial resolutions of the order of 100 nanometers can be obtained. The duration of the emission process of the photoemitted electrons used to make images is shown to be of the order of 100 fs using an autocorrelation technique. The compact geometry of this photoelectron point projection microscope does not preclude its use as a simple ultrafast electron microscope, and we use simple analytic models to estimate temporal resolutions that can be expected when using it as a pump-probe ultrafast electron microscope. These models show a significant increase in temporal resolution when comparing to ultrafast electron microscopes based on conventional designs. We also model the microscopes spectroscopic abilities to capture ultrafast phenomena such as the photon induced near field effect

Electron holography at atomic dimensions -- Present state

International Nuclear Information System (INIS)

Lehmann, M.; Lichte, H.

1999-01-01

An electron microscope is a wave optical instrument where the object information is carried by an electron wave. However, an important information, the phase of the electron wave, is lost, because only intensities can be recorded in a conventional electron micrograph. Off-axis electron holography solves this phase problem by encoding amplitude and phase information in an interference pattern, the so-called hologram. After reconstruction, a rather unrestricted wave optical analysis can be performed on a computer. The possibilities as well as the current limitations of off-axis electron holography at atomic dimensions are discussed, and they are illustrated at two applications of structure characterization of ε-NbN and YBCO-1237. Finally, an electron microscope equipped with a Cs-corrector, a monochromator, and a Moellenstedt biprism is outlined for subangstrom holography

Atomic force microscopic imaging of Acanthamoeba castellanii and Balamuthia mandrillaris trophozoites and cysts.

Science.gov (United States)

Aqeel, Yousuf; Siddiqui, Ruqaiyyah; Ateeq, Muhammad; Raza Shah, Muhammad; Kulsoom, Huma; Khan, Naveed Ahmed

2015-01-01

Light microscopy and electron microscopy have been successfully used in the study of microbes, as well as free-living protists. Unlike light microscopy, which enables us to observe living organisms or the electron microscope which provides a two-dimensional image, atomic force microscopy provides a three-dimensional surface profile. Here, we observed two free-living amoebae, Acanthamoeba castellanii and Balamuthia mandrillaris under the phase contrast inverted microscope, transmission electron microscope and atomic force microscope. Although light microscopy was of lower magnification, it revealed functional biology of live amoebae such as motility and osmoregulation using contractile vacuoles of the trophozoite stage, but it is of limited value in defining the cyst stage. In contrast, transmission electron microscopy showed significantly greater magnification and resolution to reveal the ultra-structural features of trophozoites and cysts including intracellular organelles and cyst wall characteristics but it only produced a snapshot in time of a dead amoeba cell. Atomic force microscopy produced three-dimensional images providing detailed topographic description of shape and surface, phase imaging measuring boundary stiffness, and amplitude measurements including width, height and length of A. castellanii and B. mandrillaris trophozoites and cysts. These results demonstrate the importance of the application of various microscopic methods in the biological and structural characterization of the whole cell, ultra-structural features, as well as surface components and cytoskeleton of protist pathogens. © 2014 The Author(s) Journal of Eukaryotic Microbiology © 2014 International Society of Protistologists.

Investigation of C3 S hydration mechanism by transmission electron microscope (TEM) with integrated Super-XTM EDS system.

Science.gov (United States)

Sakalli, Y; Trettin, R

2017-07-01

Tricalciumsilicate (C 3 S, Alite) is the major component of the Portland cement clinker. Hydration of Alite is decisive in influencing the properties of the resulting material. This is due to its high content in cement. The mechanism of the hydration of C 3 S is very complicated and not yet fully understood. There are different models describing the hydration of C 3 S in various ways. In this work for a better understanding of hydration mechanism, the hydrated C 3 S was investigated by using the transmission electron microscope (TEM) and for the first time, the samples for the investigations were prepared by using of focused ion beam from sintered pellets of C 3 S. Also, an FEI Talos F200x with an integrated Super-X EDS system was used for the investigations. FEI Talos F200X combines outstanding high-resolution S/TEM and TEM imaging with energy dispersive X-ray spectroscopy signal detection, and 3D chemical characterization with compositional mapping. TEM is a very powerful tool for material science. A high energy beam of electrons passes through a very thin sample, and the interactions between the electrons and the atoms can be used to observe the structure of the material and other features in the structure. TEM can be used to study the growth of layers and their composition. TEM produces high-resolution, two-dimensional images and will be used for a wide range of educational, science and industry applications. Chemical analysis can also be performed. The purpose of these investigations was to get the information about the composition of the C-S-H phases and some details of the nanostructure of the C-S-H phases. © 2017 The Authors Journal of Microscopy © 2017 Royal Microscopical Society.

Investigation on the traceability of three dimensional scanning electron microscope measurements based on the stereo-pair technique

DEFF Research Database (Denmark)

Bariani, Paolo; De Chiffre, Leonardo; Hansen, Hans Nørgaard

2005-01-01

An investigation was carried out concerning the traceability of dimensional measurements performed with the scanning electron microscope (SEM) using reconstruction of surface topography through stereo-photogrammetry. A theoretical description of the effects that the main instrumental variables...... with the scanning electron microscope (SEM) using reconstruction of surface topography through stereo-photogrammetry. A theoretical description of the effects that the main instrumental variables and measurement parameters have on the reconstruction accuracy of any point on the surface of the object being imaged......-dimensional topography of the type C roughness standards showed good agreement with the nominal profile wavelength values. An investigation was carried out concerning the traceability of dimensional measurements performed with the scanning electron microscope (SEM) using reconstruction of surface topography through...

A simple way to obtain backscattered electron images in a scanning transmission electron microscope.

Science.gov (United States)

Tsuruta, Hiroki; Tanaka, Shigeyasu; Tanji, Takayoshi; Morita, Chiaki

2014-08-01

We have fabricated a simple detector for backscattered electrons (BSEs) and incorporated the detector into a scanning transmission electron microscope (STEM) sample holder. Our detector was made from a 4-mm(2) Si chip. The fabrication procedure was easy, and similar to a standard transmission electron microscopy (TEM) sample thinning process based on ion milling. A TEM grid containing particle objects was fixed to the detector with a silver paste. Observations were carried out using samples of Au and latex particles at 75 and 200 kV. Such a detector provides an easy way to obtain BSE images in an STEM. © The Author 2014. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oup.com.

Note: Electron energy spectroscopy mapping of surface with scanning tunneling microscope.

Science.gov (United States)

Li, Meng; Xu, Chunkai; Zhang, Panke; Li, Zhean; Chen, Xiangjun

2016-08-01

We report a novel scanning probe electron energy spectrometer (SPEES) which combines a double toroidal analyzer with a scanning tunneling microscope to achieve both topography imaging and electron energy spectroscopy mapping of surface in situ. The spatial resolution of spectroscopy mapping is determined to be better than 0.7 ± 0.2 μm at a tip sample distance of 7 μm. Meanwhile, the size of the field emission electron beam spot on the surface is also measured, and is about 3.6 ± 0.8 μm in diameter. This unambiguously demonstrates that the spatial resolution of SPEES technique can be much better than the size of the incident electron beam.

Note: Electron energy spectroscopy mapping of surface with scanning tunneling microscope

Energy Technology Data Exchange (ETDEWEB)

Li, Meng; Xu, Chunkai, E-mail: xuck@ustc.edu.cn, E-mail: xjun@ustc.edu.cn; Zhang, Panke; Li, Zhean; Chen, Xiangjun, E-mail: xuck@ustc.edu.cn, E-mail: xjun@ustc.edu.cn [Hefei National Laboratory for Physical Science at Microscale and Department of Modern Physics, University of Science and Technology of China, Hefei 230026, China and Synergetic Innovation Center of Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei 230026 (China)

2016-08-15

We report a novel scanning probe electron energy spectrometer (SPEES) which combines a double toroidal analyzer with a scanning tunneling microscope to achieve both topography imaging and electron energy spectroscopy mapping of surface in situ. The spatial resolution of spectroscopy mapping is determined to be better than 0.7 ± 0.2 μm at a tip sample distance of 7 μm. Meanwhile, the size of the field emission electron beam spot on the surface is also measured, and is about 3.6 ± 0.8 μm in diameter. This unambiguously demonstrates that the spatial resolution of SPEES technique can be much better than the size of the incident electron beam.

Note: Electron energy spectroscopy mapping of surface with scanning tunneling microscope

International Nuclear Information System (INIS)

Li, Meng; Xu, Chunkai; Zhang, Panke; Li, Zhean; Chen, Xiangjun

2016-01-01

We report a novel scanning probe electron energy spectrometer (SPEES) which combines a double toroidal analyzer with a scanning tunneling microscope to achieve both topography imaging and electron energy spectroscopy mapping of surface in situ. The spatial resolution of spectroscopy mapping is determined to be better than 0.7 ± 0.2 μm at a tip sample distance of 7 μm. Meanwhile, the size of the field emission electron beam spot on the surface is also measured, and is about 3.6 ± 0.8 μm in diameter. This unambiguously demonstrates that the spatial resolution of SPEES technique can be much better than the size of the incident electron beam.

Field electron emission characteristics of chemical vapour deposition diamond films with controlled sp2 phase concentration

International Nuclear Information System (INIS)

Lu, X.; Yang, Q.; Xiao, C.; Hirose, A.

2008-01-01

Diamond films were synthesized in a microwave plasma-enhanced chemical vapour deposition reactor. The microstructure and surface morphology of deposited films were characterized by Raman spectroscope and scanning electron microscope. The sp 2 phase concentration in diamond films was varied and its effect on the field electron emission (FEE) properties was investigated. Diamond films deposited under higher methane concentration exhibit better FEE property including lower turn-on electric field and larger emission current. The predominating factor modifying the FEE property is presumed to be the increase of sp 2 phase concentration. The influence of bias voltage on the FEE property of diamond films is not monotonic. Postgrowth acid treatment reduces the sp 2 phase content in diamond films without changing diamond grain sizes. The corresponding FEE property was degraded

In Situ Characterization of Inconel 718 Post-Dynamic Recrystallization within a Scanning Electron Microscope

Directory of Open Access Journals (Sweden)

Meriem Zouari

2017-11-01

Full Text Available Microstructure evolution within the post-dynamic regime following hot deformation was investigated in Inconel 718 samples with different dynamically recrystallized volume fractions and under conditions such that no δ-phase particles were present. In situ annealing treatments carried out to mimic post-dynamic conditions inside the Scanning Electron Microscope (SEM chamber suggest the occurrence of both metadynamic and static recrystallization mechanisms. Static recrystallization was observed in addition to metadynamic recrystallization, only when the initial dynamically recrystallized volume fraction was very small. The initial volume fraction of dynamically recrystallized grains appears to be decisive for subsequent microstructural evolution mechanisms and kinetics. In addition, the formation of annealing twins is observed along with the growth of recrystallized grains, but then the twin density decreases as the material enters the capillarity-driven grain growth regime.

Scanning Electron Microscope Calibration Using a Multi-Image Non-Linear Minimization Process

Science.gov (United States)

Cui, Le; Marchand, Éric

2015-04-01

A scanning electron microscope (SEM) calibrating approach based on non-linear minimization procedure is presented in this article. A part of this article has been published in IEEE International Conference on Robotics and Automation (ICRA), 2014. . Both the intrinsic parameters and the extrinsic parameters estimations are achieved simultaneously by minimizing the registration error. The proposed approach considers multi-images of a multi-scale calibration pattern view from different positions and orientations. Since the projection geometry of the scanning electron microscope is different from that of a classical optical sensor, the perspective projection model and the parallel projection model are considered and compared with distortion models. Experiments are realized by varying the position and the orientation of a multi-scale chessboard calibration pattern from 300× to 10,000×. The experimental results show the efficiency and the accuracy of this approach.

Nanometer-scale lithography on microscopically clean graphene

DEFF Research Database (Denmark)

van Dorp, W. F.; Zhang, X.; Feringa, B. L.

2011-01-01

Focused-electron-beam-induced deposition, or FEBID, enables the fabrication of patterns with sub-10 nm resolution. The initial stages of metal deposition by FEBID are still not fundamentally well understood. For these investigations, graphene, a one-atom-thick sheet of carbon atoms in a hexagonal...... lattice, is ideal as the substrate for FEBID writing. In this paper, we have used exfoliated few-layer graphene as a support to study the early growth phase of focused-electron-beam-induced deposition and to write patterns with dimensions between 0.6 and 5 nm. The results obtained here are compared...... to the deposition behavior on amorphous materials. Prior to the deposition experiment, the few-layer graphene was cleaned. Typically, it is observed in electron microscope images that areas of microscopically clean graphene are surrounded by areas with amorphous material. We present a method to remove the amorphous...

Tunneling rates in electron transport through double-barrier molecular junctions in a scanning tunneling microscope.

Science.gov (United States)

Nazin, G V; Wu, S W; Ho, W

2005-06-21

The scanning tunneling microscope enables atomic-scale measurements of electron transport through individual molecules. Copper phthalocyanine and magnesium porphine molecules adsorbed on a thin oxide film grown on the NiAl(110) surface were probed. The single-molecule junctions contained two tunneling barriers, vacuum gap, and oxide film. Differential conductance spectroscopy shows that electron transport occurs via vibronic states of the molecules. The intensity of spectral peaks corresponding to the individual vibronic states depends on the relative electron tunneling rates through the two barriers of the junction, as found by varying the vacuum gap tunneling rate by changing the height of the scanning tunneling microscope tip above the molecule. A simple, sequential tunneling model explains the observed trends.

Using machine-learning to optimize phase contrast in a low-cost cellphone microscope

Science.gov (United States)

Wartmann, Rolf; Schadwinkel, Harald; Heintzmann, Rainer

2018-01-01

Cellphones equipped with high-quality cameras and powerful CPUs as well as GPUs are widespread. This opens new prospects to use such existing computational and imaging resources to perform medical diagnosis in developing countries at a very low cost. Many relevant samples, like biological cells or waterborn parasites, are almost fully transparent. As they do not exhibit absorption, but alter the light’s phase only, they are almost invisible in brightfield microscopy. Expensive equipment and procedures for microscopic contrasting or sample staining often are not available. Dedicated illumination approaches, tailored to the sample under investigation help to boost the contrast. This is achieved by a programmable illumination source, which also allows to measure the phase gradient using the differential phase contrast (DPC) [1, 2] or even the quantitative phase using the derived qDPC approach [3]. By applying machine-learning techniques, such as a convolutional neural network (CNN), it is possible to learn a relationship between samples to be examined and its optimal light source shapes, in order to increase e.g. phase contrast, from a given dataset to enable real-time applications. For the experimental setup, we developed a 3D-printed smartphone microscope for less than 100 $ using off-the-shelf components only such as a low-cost video projector. The fully automated system assures true Koehler illumination with an LCD as the condenser aperture and a reversed smartphone lens as the microscope objective. We show that the effect of a varied light source shape, using the pre-trained CNN, does not only improve the phase contrast, but also the impression of an improvement in optical resolution without adding any special optics, as demonstrated by measurements. PMID:29494620

Scanning electron microscope autoradiography of critical point dried biological samples

International Nuclear Information System (INIS)

Weiss, R.L.

1980-01-01

A technique has been developed for the localization of isotopes in the scanning electron microscope. Autoradiographic studies have been performed using a model system and a unicellular biflagellate alga. One requirement of this technique is that all manipulations be carried out on samples that are maintained in a liquid state. Observations of a source of radiation ( 125 I-ferritin) show that the nuclear emulsion used to detect radiation is active under these conditions. Efficiency measurement performed using 125 I-ferritin indicate that 125 I-SEM autoradiography is an efficient process that exhibits a 'dose dependent' response. Two types of labeling methods were used with cells, surface labeling with 125 I and internal labeling with 3 H. Silver grains appeared on labeled cells after autoradiography, removal of residual gelatin and critical point drying. The location of grains was examined on a flagellated green alga (Chlamydomonas reinhardi) capable of undergoing cell fusion. Fusion experiments using labeled and unlabeled cells indicate that 1. Labeling is specific for incorporated radioactivity; 2. Cell surface structure is preserved in SEM autoradiographs and 3. The technique appears to produce reliable autoradiographs. Thus scanning electron microscope autoradiography should provide a new and useful experimental approach

Microscopic analysis of order parameters in nuclear quantum phase transitions

International Nuclear Information System (INIS)

Li, Z. P.; Niksic, T.; Vretenar, D.; Meng, J.

2009-01-01

Microscopic signatures of nuclear ground-state shape phase transitions in Nd isotopes are studied using excitation spectra and collective wave functions obtained by diagonalization of a five-dimensional Hamiltonian for quadrupole vibrational and rotational degrees of freedom, with parameters determined by constrained self-consistent relativistic mean-field calculations for triaxial shapes. As a function of the physical control parameter, the number of nucleons, energy gaps between the ground state and the excited vibrational states with zero angular momentum, isomer shifts, and monopole transition strengths exhibit sharp discontinuities at neutron number N=90, which is characteristic of a first-order quantum phase transition.

Hybridization approach to in-line and off-axis (electron) holography for superior resolution and phase sensitivity

Science.gov (United States)

Ozsoy-Keskinbora, C.; Boothroyd, C. B.; Dunin-Borkowski, R. E.; van Aken, P. A.; Koch, C. T.

2014-01-01

Holography - originally developed for correcting spherical aberration in transmission electron microscopes - is now used in a wide range of disciplines that involve the propagation of waves, including light optics, electron microscopy, acoustics and seismology. In electron microscopy, the two primary modes of holography are Gabor's original in-line setup and an off-axis approach that was developed subsequently. These two techniques are highly complementary, offering superior phase sensitivity at high and low spatial resolution, respectively. All previous investigations have focused on improving each method individually. Here, we show how the two approaches can be combined in a synergetic fashion to provide phase information with excellent sensitivity across all spatial frequencies, low noise and an efficient use of electron dose. The principle is also expected to be widely to applications of holography in light optics, X-ray optics, acoustics, ultra-sound, terahertz imaging, etc. PMID:25387480

Influence of continuous electron irradiation and different modes of mechanic-thermal treatment on structure-phase composition of alloys 36NKhTYu and 40KhNYu

International Nuclear Information System (INIS)

Alontseva, D.L.; Suslov, S.E.; Kupchishin, A.I.; Plotnikov, S.V.; Petrov, V.A.

2002-01-01

Principal regularities of structure formation in strongly deformed alloys 36NKhTYu and 40KhNYu under aging in certain temperature range and after electron irradiation are revealed. Morphological features of precipitating phases with purpose of development of methods for getting of optimal structural states providing essential properties rate were determined. Data of electron microscopic examinations of structure-phase composition are compared with data on mechanical properties

Nanosecond time-resolved investigations using the in situ of dynamic transmission electron microscope (DTEM)

International Nuclear Information System (INIS)

LaGrange, Thomas; Campbell, Geoffrey H.; Reed, B.W.; Taheri, Mitra; Pesavento, J. Bradley; Kim, Judy S.; Browning, Nigel D.

2008-01-01

Most biological processes, chemical reactions and materials dynamics occur at rates much faster than can be captured with standard video rate acquisition methods in transmission electron microscopes (TEM). Thus, there is a need to increase the temporal resolution in order to capture and understand salient features of these rapid materials processes. This paper details the development of a high-time resolution dynamic transmission electron microscope (DTEM) that captures dynamics in materials with nanosecond time resolution. The current DTEM performance, having a spatial resolution <10 nm for single-shot imaging using 15 ns electron pulses, will be discussed in the context of experimental investigations in solid state reactions of NiAl reactive multilayer films, the study of martensitic transformations in nanocrystalline Ti and the catalytic growth of Si nanowires. In addition, this paper will address the technical issues involved with high current, electron pulse operation and the near-term improvements to the electron optics, which will greatly improve the signal and spatial resolutions, and to the laser system, which will allow tailored specimen and photocathode drive conditions

Nanosecond time-resolved investigations using the in situ of dynamic transmission electron microscope (DTEM)

Energy Technology Data Exchange (ETDEWEB)

LaGrange, Thomas [Lawrence Livermore National Laboratory, 7000 East Avenue, Livermore, CA 94550 (United States)], E-mail: lagrange@llnl.gov; Campbell, Geoffrey H.; Reed, B.W.; Taheri, Mitra; Pesavento, J. Bradley [Lawrence Livermore National Laboratory, 7000 East Avenue, Livermore, CA 94550 (United States); Kim, Judy S.; Browning, Nigel D. [Lawrence Livermore National Laboratory, 7000 East Avenue, Livermore, CA 94550 (United States); Department of Chemical Engineering and Materials Science, University of California, One Shields Avenue, Davis, CA 95616 (United States)

2008-10-15

Most biological processes, chemical reactions and materials dynamics occur at rates much faster than can be captured with standard video rate acquisition methods in transmission electron microscopes (TEM). Thus, there is a need to increase the temporal resolution in order to capture and understand salient features of these rapid materials processes. This paper details the development of a high-time resolution dynamic transmission electron microscope (DTEM) that captures dynamics in materials with nanosecond time resolution. The current DTEM performance, having a spatial resolution <10 nm for single-shot imaging using 15 ns electron pulses, will be discussed in the context of experimental investigations in solid state reactions of NiAl reactive multilayer films, the study of martensitic transformations in nanocrystalline Ti and the catalytic growth of Si nanowires. In addition, this paper will address the technical issues involved with high current, electron pulse operation and the near-term improvements to the electron optics, which will greatly improve the signal and spatial resolutions, and to the laser system, which will allow tailored specimen and photocathode drive conditions.

On the Progress of Scanning Transmission Electron Microscopy (STEM) Imaging in a Scanning Electron Microscope.

Science.gov (United States)

Sun, Cheng; Müller, Erich; Meffert, Matthias; Gerthsen, Dagmar

2018-04-01

Transmission electron microscopy (TEM) with low-energy electrons has been recognized as an important addition to the family of electron microscopies as it may avoid knock-on damage and increase the contrast of weakly scattering objects. Scanning electron microscopes (SEMs) are well suited for low-energy electron microscopy with maximum electron energies of 30 keV, but they are mainly used for topography imaging of bulk samples. Implementation of a scanning transmission electron microscopy (STEM) detector and a charge-coupled-device camera for the acquisition of on-axis transmission electron diffraction (TED) patterns, in combination with recent resolution improvements, make SEMs highly interesting for structure analysis of some electron-transparent specimens which are traditionally investigated by TEM. A new aspect is correlative SEM, STEM, and TED imaging from the same specimen region in a SEM which leads to a wealth of information. Simultaneous image acquisition gives information on surface topography, inner structure including crystal defects and qualitative material contrast. Lattice-fringe resolution is obtained in bright-field STEM imaging. The benefits of correlative SEM/STEM/TED imaging in a SEM are exemplified by structure analyses from representative sample classes such as nanoparticulates and bulk materials.

Electron holography study of magnetization behavior in the writer pole of a perpendicular magnetic recording head by a 1 MV transmission electron microscope.

Science.gov (United States)

Hirata, Kei; Ishida, Yoichi; Akashi, Tetsuya; Shindo, Daisuke; Tonomura, Akira

2012-01-01

The magnetic domain structure of the writer poles of perpendicular magnetic recording heads was studied using electron holography. Although the domain structure of a 100-nm-thick writer pole could be observed with a 300 kV transmission electron microscope, that of the 250-nm-thick writer pole could not be analyzed due to the limited transmission capability of the instrument. On the other hand, the detailed domain structure of the 250-nm-thick writer pole was successfully analyzed by a 1 MV electron microscope using its high transmission capability. The thickness and material dependency of the domain structure of a writer pole were discussed.

Structural Fingerprinting of Nanocrystals in the Transmission Electron Microscope

Science.gov (United States)

Rouvimov, Sergei; Plachinda, Pavel; Moeck, Peter

2010-03-01

Three novel strategies for the structurally identification of nanocrystals in a transmission electron microscope are presented. Either a single high-resolution transmission electron microscopy image [1] or a single precession electron diffractogram (PED) [2] may be employed. PEDs from fine-grained crystal powders may also be utilized. Automation of the former two strategies is in progress and shall lead to statistically significant results on ensembles of nanocrystals. Open-access databases such as the Crystallography Open Database which provides more than 81,500 crystal structure data sets [3] or its mainly inorganic and educational subsets [4] may be utilized. [1] http://www.scientificjournals.org/journals 2007/j/of/dissertation.htm [2] P. Moeck and S. Rouvimov, in: {Drugs and the Pharmaceutical Sciences}, Vol. 191, 2009, 270-313 [3] http://cod.ibt.lt, http://www.crystallography.net, http://cod.ensicaen.fr, http://nanocrystallography.org, http://nanocrystallography.net, http://journals.iucr.org/j/issues/2009/04/00/kk5039/kk5039.pdf [4] http://nanocrystallography.research.pdx.edu/CIF-searchable

Calibrated Phase-Shifting Digital Holographic Microscope Using a Sampling Moiré Technique

Directory of Open Access Journals (Sweden)

Peng Xia

2018-05-01

Full Text Available A calibrated phase-shifting digital holographic microscope system capable of improving the quality of reconstructed images is proposed. Phase-shifting errors are introduced in phase-shifted holograms for numerous reasons, such as the non-linearity of piezoelectric transducers (PZTs, wavelength fluctuations in lasers, and environmental disturbances, leading to poor-quality reconstructions. In our system, in addition to the camera used to record object information, an extra camera is used to record interferograms, which are used to analyze phase-shifting errors using a sampling Moiré technique. The quality of the reconstructed object images can be improved by the phase-shifting error compensation algorithm. Both the numerical simulation and experiment demonstrate the effectiveness of the proposed system.

Automated thin-film analyses of hydrated interplanetary dust particles in the analytical electron microscope

Science.gov (United States)

Germani, M. S.; Bradley, J. P.; Brownlee, D. E.

1990-01-01

A 200 keV electron microscope was used to obtain elemental analyses from over 4000 points on thin sections of eight 'layer silicate' class interplanetary dust particles (IDPs). Major and minor element abundances from a volume approaching that of a cylinder 50 nm in diameter were observed. Mineral phases and their relative abundances in the thin sections were identified and petrographic characteristics were determined. Three of the particles contained smectite (1.0-1.2 nm basal spacing) and two contained serpentine (0.7 nm basal spacing). The point count analyses and Mg-Si-Fe ternary diagrams show that one of the serpentine-containing IDPs is similar to CI and CM chondritic meteorites. The IDPs exhibit evidence of aqueous processing, but they have typically experienced only short range, submicrometer scale alteration. The IDPs may provide a broad sampling of the asteroid belt.

Comparison of Electron Imaging Modes for Dimensional Measurements in the Scanning Electron Microscope.

Science.gov (United States)

Postek, Michael T; Vladár, András E; Villarrubia, John S; Muto, Atsushi

2016-08-01

Dimensional measurements from secondary electron (SE) images were compared with those from backscattered electron (BSE) and low-loss electron (LLE) images. With the commonly used 50% threshold criterion, the lines consistently appeared larger in the SE images. As the images were acquired simultaneously by an instrument with the capability to operate detectors for both signals at the same time, the differences cannot be explained by the assumption that contamination or drift between images affected the SE, BSE, or LLE images differently. Simulations with JMONSEL, an electron microscope simulator, indicate that the nanometer-scale differences observed on this sample can be explained by the different convolution effects of a beam with finite size on signals with different symmetry (the SE signal's characteristic peak versus the BSE or LLE signal's characteristic step). This effect is too small to explain the >100 nm discrepancies that were observed in earlier work on different samples. Additional modeling indicates that those discrepancies can be explained by the much larger sidewall angles of the earlier samples, coupled with the different response of SE versus BSE/LLE profiles to such wall angles.

Pleomorphic (giant cell) carcinoma of the intestine. An immunohistochemical and electron microscopic study

DEFF Research Database (Denmark)

Bak, Martin; Teglbjaerg, P S

1989-01-01

reaction for neuron-specific enolase (NSE) was found in three tumors and a positive reaction for chromogranin was found in one tumor. On electron microscopic study, intracytoplasmic whorls of intermediate filaments were seen in the perinuclear area. Dense core "neurosecretory" granules were rarely seen......Pleomorphic (giant cell) carcinomas have been described in the lungs, thyroid, pancreas, and gallbladder. Two pleomorphic carcinomas of the small bowel and two of the large bowel are presented. On light microscopic study, the carcinomas were solid, without squamous or glandular differentiation...

Calibration for medium resolution off-axis electron holography using a flexible dual-lens imaging system in a JEOL ARM 200F microscope.

Science.gov (United States)

Cantu-Valle, Jesus; Ruiz-Zepeda, Francisco; Mendoza-Santoyo, Fernando; Jose-Yacaman, Miguel; Ponce, Arturo

2014-12-01

In this work the calibration of a medium resolution off-axis electron holography using a dual-lens imaging system in a JEOL ARM 200F is shown. The objective dual-lens configuration allows adjusting the field of view from 35nm to 2.5μm. Subsequently, the parameters used in phase shift reconstruction were calibrated considering biprism voltage versus fringe spacing (σ) and versus fringe width (W). The reliability of the transmission electron microscope performance using these parameters was achieved using gold nanoparticles of known size and adjusting the excitation voltage of the lenses. Copyright © 2014 Elsevier B.V. All rights reserved.

Scanning tunnel microscopic image of tungsten (100) and (110) real surfaces and nature of conduction electron reflection

International Nuclear Information System (INIS)

Pryadkin, S.L.; Tsoj, V.S.

1988-01-01

The electrically polished (100) and (110) surfaces of tungsten are studied with the aid of a scanning tunnel microscope at atmospheric pressure. The (110) surface consists of a large number of atomically plane terraces whereas the (100) surface is faceted. The scanning tunnel microscope data can explain such results of experiments on transverse electron focussing as the strong dependence of the probability for specular reflection of conduction electrons scattered by the (100) surface on the electron de Broglie wavelength and the absence of a dependence of the probability for specular reflection on the wavelength for the (110) surface

Interference experiment with asymmetric double slit by using 1.2-MV field emission transmission electron microscope.

Science.gov (United States)

Harada, Ken; Akashi, Tetsuya; Niitsu, Kodai; Shimada, Keiko; Ono, Yoshimasa A; Shindo, Daisuke; Shinada, Hiroyuki; Mori, Shigeo

2018-01-17

Advanced electron microscopy technologies have made it possible to perform precise double-slit interference experiments. We used a 1.2-MV field emission electron microscope providing coherent electron waves and a direct detection camera system enabling single-electron detections at a sub-second exposure time. We developed a method to perform the interference experiment by using an asymmetric double-slit fabricated by a focused ion beam instrument and by operating the microscope under a "pre-Fraunhofer" condition, different from the Fraunhofer condition of conventional double-slit experiments. Here, pre-Fraunhofer condition means that each single-slit observation was performed under the Fraunhofer condition, while the double-slit observations were performed under the Fresnel condition. The interference experiments with each single slit and with the asymmetric double slit were carried out under two different electron dose conditions: high-dose for calculation of electron probability distribution and low-dose for each single electron distribution. Finally, we exemplified the distribution of single electrons by color-coding according to the above three types of experiments as a composite image.

The improved stability of an organic crystal in the Hitachi HV-1 high vacuum electron microscope

International Nuclear Information System (INIS)

Hartman, R.S.; Hartman, R.E.; Alsberg, H.; Nathan, R.

1974-01-01

A specimen of crystalline indanthrene olive T was placed in the HV-1, which was then pumped for 2 hours. The 25 A bright field fringe pattern was then observed on the TV monitor. Deterioration was noted very shortly, and the electron microscope was then pumped for three days, after which another field was subjected to the same level of irradiation by 50 KV electrons. It was found that there was little if any deterioration even after 20 minutes. It was concluded that it is possible to find conditions in a transmission EM where stability far exceeds that predicted by current theories of radiation damage or demonstrated by conventional electron microscopes. (R.L.)

An ion-sputtering gun to clean crystal surfaces in-situ in an ultra-high-vacuum electron microscope

International Nuclear Information System (INIS)

Morita, Etsuo; Takayanagi, Kunio; Kobayashi, Kunio; Yagi, Katsumichi; Honjo, Goro

1980-01-01

The design and performance of an ion-sputtering gun for cleaning crystal surfaces in-situ in an ultra-high-vacuum electron microscope are reported. The electron microscopic aspects of ion-bombardment damage to ionic magnesium oxide, covalent germanium and silicon, and metallic gold and copper crystals, and the effects of annealing after and during sputtering are described. The growth of various kinds of films deposited in-situ on crystals cleaned by ion-sputtering are described and discussed. (author)

Energy-weighted dynamical scattering simulations of electron diffraction modalities in the scanning electron microscope.

Science.gov (United States)

Pascal, Elena; Singh, Saransh; Callahan, Patrick G; Hourahine, Ben; Trager-Cowan, Carol; Graef, Marc De

2018-04-01

Transmission Kikuchi diffraction (TKD) has been gaining momentum as a high resolution alternative to electron back-scattered diffraction (EBSD), adding to the existing electron diffraction modalities in the scanning electron microscope (SEM). The image simulation of any of these measurement techniques requires an energy dependent diffraction model for which, in turn, knowledge of electron energies and diffraction distances distributions is required. We identify the sample-detector geometry and the effect of inelastic events on the diffracting electron beam as the important factors to be considered when predicting these distributions. However, tractable models taking into account inelastic scattering explicitly are lacking. In this study, we expand the Monte Carlo (MC) energy-weighting dynamical simulations models used for EBSD [1] and ECP [2] to the TKD case. We show that the foil thickness in TKD can be used as a means of energy filtering and compare band sharpness in the different modalities. The current model is shown to correctly predict TKD patterns and, through the dictionary indexing approach, to produce higher quality indexed TKD maps than conventional Hough transform approach, especially close to grain boundaries. Copyright © 2018 The Authors. Published by Elsevier B.V. All rights reserved.

An ultrafast electron microscope gun driven by two-photon photoemission from a nanotip cathode

International Nuclear Information System (INIS)

Bormann, Reiner; Strauch, Stefanie; Schäfer, Sascha; Ropers, Claus

2015-01-01

We experimentally and numerically investigate the performance of an advanced ultrafast electron source, based on two-photon photoemission from a tungsten needle cathode incorporated in an electron microscope gun geometry. Emission properties are characterized as a function of the electrostatic gun settings, and operating conditions leading to laser-triggered electron beams of very low emittance (below 20 nm mrad) are identified. The results highlight the excellent suitability of optically driven nano-cathodes for the further development of ultrafast transmission electron microscopy

Solid-state nanopores of controlled geometry fabricated in a transmission electron microscope

Science.gov (United States)

Qian, Hui; Egerton, Ray F.

2017-11-01

Energy-filtered transmission electron microscopy and electron tomography were applied to in situ studies of the formation, shape, and diameter of nanopores formed in a silicon nitride membrane in a transmission electron microscope. The nanopore geometry was observed in three dimensions by electron tomography. Drilling conditions, such as probe current, beam convergence angle, and probe position, affect the formation rate and the geometry of the pores. With a beam convergence semi-angle of α = 22 mrad, a conical shaped nanopore is formed but at α = 45 mrad, double-cone (hourglass-shaped) nanopores were produced. Nanopores with an effective diameter between 10 nm and 1.8 nm were fabricated by controlling the drilling time.

Electron and Cooper-pair transport across a single magnetic molecule explored with a scanning tunneling microscope

Science.gov (United States)

Brand, J.; Gozdzik, S.; Néel, N.; Lado, J. L.; Fernández-Rossier, J.; Kröger, J.

2018-05-01

A scanning tunneling microscope is used to explore the evolution of electron and Cooper-pair transport across single Mn-phthalocyanine molecules adsorbed on Pb(111) from tunneling to contact ranges. Normal-metal as well as superconducting tips give rise to a gradual transition of the Bardeen-Cooper-Schrieffer energy gap in the tunneling range into a zero-energy resonance close to and at contact. Supporting transport calculations show that in the normal-metal-superconductor junctions this resonance reflects the merging of in-gap Yu-Shiba-Rusinov states as well as the onset of Andreev reflection. For the superconductor-superconductor contacts, the zero-energy resonance is rationalized in terms of a finite Josephson current that is carried by phase-dependent Andreev and Yu-Shiba-Rusinov levels.

Transmission electron microscopic study of pyrochlore to defect-fluorite transition in rare-earth pyrohafnates

Energy Technology Data Exchange (ETDEWEB)

Karthik, Chinnathambi, E-mail: Karthikchinnathambi@boisestate.edu [Department of Materials Science and Engineering, Boise State University, 1910 University drive, Boise, ID 83725 (United States); Center for Advanced Energy Studies, 995 University Blvd, Idaho Falls, ID 83415 (United States); Anderson, Thomas J. [Department of Materials Science and Engineering, Boise State University, 1910 University drive, Boise, ID 83725 (United States); Gout, Delphine [Oak Ridge National Lab, Neutron Scattering Science Division, Oak Ridge, TN (United States); Ubic, Rick [Department of Materials Science and Engineering, Boise State University, 1910 University drive, Boise, ID 83725 (United States); Center for Advanced Energy Studies, 995 University Blvd, Idaho Falls, ID 83415 (United States)

2012-10-15

A structural transition in rare earth pyrohafnates, Ln{sub 2}Hf{sub 2}O{sub 7} (Ln=Y, La, Pr, Nd, Tb, Dy, Yb and Lu), has been identified. Neutron diffraction showed that the structure transforms from well-ordered pyrochloric to fully fluoritic through the lanthanide series from La to Lu with a corresponding increase in the position parameter x of the 48f (Fd3{sup Macron }m) oxygen site from 0.330 to 0.375. As evidenced by the selected area electron diffraction, La{sub 2}Hf{sub 2}O{sub 7}, Pr{sub 2}Hf{sub 2}O{sub 7} and Nd{sub 2}Hf{sub 2}O{sub 7} exhibited a well-ordered pyrocholoric structure with the presence of intense superlattice spots, which became weak and diffuse (in Dy{sub 2}Hf{sub 2}O{sub 7} and Tb{sub 2}Hf{sub 2}O{sub 7}) before disappearing completely as the series progressed towards the Lu end. High resolution electron microscopic studies showed the breakdown of the pyrochlore ordering in the form of antiphase domains resulting in diffused smoke-like superlattice spots in the case of Dy{sub 2}Hf{sub 2}O{sub 7} and Tb{sub 2}Hf{sub 2}O{sub 7}. - Graphical abstract: Transmission electron microscopic studies showed the ordered pyrochlore to defect fluorite transition in rare-earth pyrohafnates to occur via the formation of anti-phase domains to start with. Highlights: Black-Right-Pointing-Pointer Pyrochlore to fluorite structural transition in rare earth pyrohafnates. Black-Right-Pointing-Pointer La{sub 2}Hf{sub 2}O{sub 7}, Pr{sub 2}Hf{sub 2}O{sub 7} and Nd{sub 2}Hf{sub 2}O{sub 7} showed well ordered pyrochlore structure. Black-Right-Pointing-Pointer Short range ordering in Dy{sub 2}Hf{sub 2}O{sub 7} and Tb{sub 2}Hf{sub 2}O{sub 7}. Black-Right-Pointing-Pointer Break down of pyrochlore ordering due to antiphase boundaries. Black-Right-Pointing-Pointer Rest of the series showed fluoritic structure.

Thin-film thickness measurement using x-ray peak ratioing in the scanning electron microscope

International Nuclear Information System (INIS)

Elliott, N.E.; Anderson, W.E.; Archuleta, T.A.; Stupin, D.M.

1981-01-01

The procedure used to measure laser target film thickness using a scanning electron microscope is summarized. This method is generally applicable to any coating on any substrate as long as the electron energy is sufficient to penetrate the coating and the substrate produces an x-ray signal which can pass back through the coating and be detected

Electron Holography: phases matter.

Science.gov (United States)

Lichte, Hannes

2013-06-01

Essentially, all optics is wave optics, be it with light, X-rays, neutrons or electrons. The information transfer from the object to the image can only be understood in terms of waves given by amplitude and phase. However, phases are difficult to measure: for slowly oscillating waves such as sound or low-frequency electromagnetic waves, phases can be measured directly; for high frequencies this has to be done by heterodyne detection, i.e. superposition with a reference and averaging over time. In optics, this is called interferometry. Because interference is mostly very difficult to achieve, phases have often been considered 'hidden variables' seemingly pulling the strings from backstage, only visible by their action on the image intensity. This was almost the case in conventional Electron Microscopy with the phase differences introduced by an object. However, in the face of the urgent questions from solid state physics and materials science, these phases have to be determined precisely, because they encode the most dominant object properties, such as charge distributions and electromagnetic fields. After more than six decades of very patient advancement, electron interferometry and holography offer unprecedented analytical facilities down to an atomic scale. Akira Tonomura has prominently contributed to the present state.

Theory of life time measurements with the scanning electron microscope: steady state

NARCIS (Netherlands)

Berz, F.; Kuiken, H.K.

1976-01-01

A theoretical steady state analysis is given of the scanning electron microscope method of measuring bulk life time in diodes, where the plane of the junction is perpendicular to the surface. The current in the junction is obtained as a function of the beam power, the beam penetration into the

Energy-filtered real- and k-space secondary and energy-loss electron imaging with Dual Emission Electron spectro-Microscope: Cs/Mo(110)

Energy Technology Data Exchange (ETDEWEB)

Grzelakowski, Krzysztof P., E-mail: k.grzelakowski@opticon-nanotechnology.com

2016-05-15

Since its introduction the importance of complementary k{sub ||}-space (LEED) and real space (LEEM) information in the investigation of surface science phenomena has been widely demonstrated over the last five decades. In this paper we report the application of a novel kind of electron spectromicroscope Dual Emission Electron spectroMicroscope (DEEM) with two independent electron optical channels for reciprocal and real space quasi-simultaneous imaging in investigation of a Cs covered Mo(110) single crystal by using the 800 eV electron beam from an “in-lens” electron gun system developed for the sample illumination. With the DEEM spectromicroscope it is possible to observe dynamic, irreversible processes at surfaces in the energy-filtered real space and in the corresponding energy-filtered k{sub ǁ}-space quasi-simultaneously in two independent imaging columns. The novel concept of the high energy electron beam sample illumination in the cathode lens based microscopes allows chemically selective imaging and analysis under laboratory conditions. - Highlights: • A novel concept of the electron sample illumination with “in-lens” e- gun is realized. • Quasi-simultaneous energy selective observation of the real- and k-space in EELS mode. • Observation of the energy filtered Auger electron diffraction at Cs atoms on Mo(110). • Energy-loss, Auger and secondary electron momentum microscopy is realized.

[Thirty years of the electron microscope investigation in zoology and parasitology in the Zoological Institute of the Russian Academy of Sciences].

Science.gov (United States)

Shatrov, A B

2003-01-01

The history of the electron microscope investigations in zoology and parasitology in the Zoological Institute of the Russian Academy of Sciences and progress in scanning and transmission electron microscope investigations in this field of biology to the moment are briefly accounted.

Resizing metal-coated nanopores using a scanning electron microscope.

Science.gov (United States)

Chansin, Guillaume A T; Hong, Jongin; Dusting, Jonathan; deMello, Andrew J; Albrecht, Tim; Edel, Joshua B

2011-10-04

Electron beam-induced shrinkage provides a convenient way of resizing solid-state nanopores in Si(3) N(4) membranes. Here, a scanning electron microscope (SEM) has been used to resize a range of different focussed ion beam-milled nanopores in Al-coated Si(3) N(4) membranes. Energy-dispersive X-ray spectra and SEM images acquired during resizing highlight that a time-variant carbon deposition process is the dominant mechanism of pore shrinkage, although granular structures on the membrane surface in the vicinity of the pores suggest that competing processes may occur. Shrinkage is observed on the Al side of the pore as well as on the Si(3) N(4) side, while the shrinkage rate is observed to be dependent on a variety of factors. Copyright © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Electron-irradiation-induced phase transformation in alumina

International Nuclear Information System (INIS)

Chen, C.L.; Arakawa, K.; Lee, J.-G.; Mori, H.

2010-01-01

In this study, electron-irradiation-induced phase transformations between alumina polymorphs were investigated by high-resolution transmission electron microscopy. It was found that the electron-irradiation-induced α → κ' phase transformation occurred in the alumina under 100 keV electron irradiation. It is likely that the knock-on collision between incident electrons and Al 3+ cations is responsible for the occurrence of electron-irradiation-induced phase transformation from α-alumina to κ'-alumina.

Permanent magnet finger-size scanning electron microscope columns

Energy Technology Data Exchange (ETDEWEB)

Nelliyan, K., E-mail: elenk@nus.edu.sg [Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore 117576 (Singapore); Khursheed, A. [Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore 117576 (Singapore)

2011-07-21

This paper presents permanent magnet scanning electron microscope (SEM) designs for both tungsten and field emission guns. Each column makes use of permanent magnet technology and operates at a fixed primary beam voltage. A prototype column operating at a beam voltage of 15 kV was made and tested inside the specimen chamber of a conventional SEM. A small electrostatic stigmator unit and dedicated scanning coils were integrated into the column. The scan coils were wound directly around the objective lens iron core in order to reduce its size. Preliminary experimental images of a test grid specimen were obtained through the prototype finger-size column, demonstrating that it is in principle feasible.

Permanent magnet finger-size scanning electron microscope columns

International Nuclear Information System (INIS)

Nelliyan, K.; Khursheed, A.

2011-01-01

This paper presents permanent magnet scanning electron microscope (SEM) designs for both tungsten and field emission guns. Each column makes use of permanent magnet technology and operates at a fixed primary beam voltage. A prototype column operating at a beam voltage of 15 kV was made and tested inside the specimen chamber of a conventional SEM. A small electrostatic stigmator unit and dedicated scanning coils were integrated into the column. The scan coils were wound directly around the objective lens iron core in order to reduce its size. Preliminary experimental images of a test grid specimen were obtained through the prototype finger-size column, demonstrating that it is in principle feasible.

Electron-microscope study of cloud and fog nuclei

Energy Technology Data Exchange (ETDEWEB)

Ogiwara, S; Okita, T

1952-01-01

Droplets of clouds on a mountain and of fog in an urban area were captured and the form, nature and size of their nuclei were studied by means of an electron-microscope and by a chamber of constant humidity. These nuclei have similar form and nature to the hygroscopic particles in haze and to the artificially produced combustion particles. No sea-salt nuclei were found in our observations, therefore, sea-spray appears to be an insignificant source of condensation nuclei. It was found that both the cloud and the fog nuclei originated in combustion products which were the mixture of hygroscopic and non-hygroscopic substances, and that the greater part of the nuclei did not contain pure sulfuric acid.

Transmission electron microscope sample holder with optical features

Science.gov (United States)

Milas, Mirko [Port Jefferson, NY; Zhu, Yimei [Stony Brook, NY; Rameau, Jonathan David [Coram, NY

2012-03-27

A sample holder for holding a sample to be observed for research purposes, particularly in a transmission electron microscope (TEM), generally includes an external alignment part for directing a light beam in a predetermined beam direction, a sample holder body in optical communication with the external alignment part and a sample support member disposed at a distal end of the sample holder body opposite the external alignment part for holding a sample to be analyzed. The sample holder body defines an internal conduit for the light beam and the sample support member includes a light beam positioner for directing the light beam between the sample holder body and the sample held by the sample support member.

Nonlinear optical response in condensed phases : A microscopic theory using the multipolar Hamiltonian

NARCIS (Netherlands)

Knoester, Jasper; Mukamel, Shaul

1990-01-01

A general scheme is presented for calculating the nonlinear optical response in condensed phases that provides a unified picture of excitons, polaritons, retardation, and local-field effects in crystals and in disordered systems. A fully microscopic starting point is taken by considering the

Optical depth sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscope

International Nuclear Information System (INIS)

Behan, G; Nellist, P D

2008-01-01

The use of spherical aberration correctors in the scanning transmission electron microscope (STEM) has the effect of reducing the depth of field of the microscope, making three-dimensional imaging of a specimen possible by optical sectioning. Depth resolution can be improved further by placing aberration correctors and lenses pre and post specimen to achieve an imaging mode known as scanning confocal electron microscopy (SCEM). We present the calculated incoherent point spread functions (PSF) and optical transfer functions (OTF) of a STEM and SCEM. The OTF for a STEM is shown to have a missing cone region which results in severe blurring along the optic axis, which can be especially severe for extended objects. We also present strategies for reconstruction of experimental data, such as three-dimensional deconvolution of the point spread function.

Characterization of calcium crystals in Abelia using x-ray diffraction and electron microscopes

Science.gov (United States)

Localization, chemical composition, and morphology of calcium crystals in leaves and stems of Abelia mosanensis and A. ×grandiflora were analyzed with a variable pressure scanning electron microscope (VP-SEM) equipped with an X-ray diffraction system, low temperature SEM (LT-SEM) and a transmission ...

Optimization of an analytical electron microscope for x-ray microanalysis: instrumental problems

International Nuclear Information System (INIS)

Bentley, J.; Zaluzec, N.J.; Kenik, E.A.; Carpenter, R.W.

1979-01-01

The addition of an energy dispersive x-ray spectrometer to a modern transmission or scanning transmission electron microscope can provide a powerful tool in the characterization of the materials. Unfortunately this seemingly simple modification can lead to a host of instrumental problems with respect to the accuracy, validity, and quality of the recorded information. This tutorial reviews the complications which can arise in performing x-ray microanalysis in current analytical electron microscopes. The first topic treated in depth is fluorescence by uncollimated radiation. The source, distinguishing characteristics, effects on quantitative analysis and schemes for elimination or minimization as applicable to TEM/STEMs, D-STEMs and HVEMs are discussed. The local specimen environment is considered in the second major section where again detrimental effects on quantitative analysis and remedial procedures, particularly the use of low-background specimen holers, are highlighted. Finally, the detrimental aspects of specimen contamination, insofar as they affect x-ray microanalysis, are discussed. It is concluded that if the described preventive measures are implemented, reliable quantitative analysis is possible

Instrumental Developments for In-situ Breakdown Experiments inside a Scanning Electron Microscope

CERN Document Server

Muranaka, T; Leifer, K; Ziemann, V

2011-01-01

Electrical discharges in accelerating structures are one of the key issues limiting the performance of future high energy accelerators such as the Compact Linear Collider (CLIC). Fundamental understanding of breakdown phenomena is an indispensable part of the CLIC feasibility study. The present work concerns the experimental study of breakdown using Scanning Electron Microscopes (SEMs). A SEM gives us the opportunity to achieve high electrical gradients of 1\\,kV/$\\mu$m which corresponds to 1\\,GV/m by exciting a probe needle with a high voltage power supply and controlling the positioning of the needle with a linear piezo motor. The gap between the needle tip and the surface is controlled with sub-micron precision. A second electron microscope equipped with a Focused Ion Beam (FIB) is used to create surface corrugations and to sharpen the probe needle to a tip radius of about 50\\,nm. Moreover it is used to prepare cross sections of a voltage breakdown area in order to study the geometrical surface damages as w...

Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope

Energy Technology Data Exchange (ETDEWEB)

Wang, Peng; Behan, Gavin; Kirkland, Angus I. [Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH (United Kingdom); Nellist, Peter D., E-mail: peter.nellist@materials.ox.ac.uk [Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH (United Kingdom); Cosgriff, Eireann C.; D' Alfonso, Adrian J.; Morgan, Andrew J.; Allen, Leslie J. [School of Physics, University of Melbourne, Parkville, Victoria 3010 (Australia); Hashimoto, Ayako [Advanced Nano-characterization Center, National Institute for Materials Science (NIMS), 3-13 Sakura, Tsukuba 305-0003 (Japan); Takeguchi, Masaki [Advanced Nano-characterization Center, National Institute for Materials Science (NIMS), 3-13 Sakura, Tsukuba 305-0003 (Japan); High Voltage Electron Microscopy Station, NIMS, 3-13 Sakura, Tsukuba 305-0003 (Japan); Mitsuishi, Kazutaka [Advanced Nano-characterization Center, National Institute for Materials Science (NIMS), 3-13 Sakura, Tsukuba 305-0003 (Japan); Quantum Dot Research Center, NIMS, 3-13 Sakura, Tsukuba 305-0003 (Japan); Shimojo, Masayuki [High Voltage Electron Microscopy Station, NIMS, 3-13 Sakura, Tsukuba 305-0003 (Japan); Advanced Science Research Laboratory, Saitama Institute of Technology, 1690 Fusaiji, Fukaya 369-0293 (Japan)

2011-06-15

Scanning confocal electron microscopy (SCEM) offers a mechanism for three-dimensional imaging of materials, which makes use of the reduced depth of field in an aberration-corrected transmission electron microscope. The simplest configuration of SCEM is the bright-field mode. In this paper we present experimental data and simulations showing the form of bright-field SCEM images. We show that the depth dependence of the three-dimensional image can be explained in terms of two-dimensional images formed in the detector plane. For a crystalline sample, this so-called probe image is shown to be similar to a conventional diffraction pattern. Experimental results and simulations show how the diffracted probes in this image are elongated in thicker crystals and the use of this elongation to estimate sample thickness is explored. -- Research Highlights: {yields} The confocal probe image in a scanning confocal electron microscopy image reveals information about the thickness and height of the crystalline layer. {yields} The form of the contrast in a three-dimensional bright-field scanning confocal electron microscopy image can be explained in terms of the confocal probe image. {yields} Despite the complicated form of the contrast in bright-field scanning confocal electron microscopy, we see that depth information is transferred on a 10 nm scale.

Electronically soft phases in manganites.

Science.gov (United States)

Milward, G C; Calderón, M J; Littlewood, P B

2005-02-10

The phenomenon of colossal magnetoresistance in manganites is generally agreed to be a result of competition between crystal phases with different electronic, magnetic and structural order; a competition which can be strong enough to cause phase separation between metallic ferromagnetic and insulating charge-modulated states. Nevertheless, closer inspection of phase diagrams in many manganites reveals complex phases where the two order parameters of magnetism and charge modulation unexpectedly coexist. Here we show that such experiments can be naturally explained within a phenomenological Ginzburg-Landau theory. In contrast to models where phase separation originates from disorder or as a strain-induced kinetic phenomenon, we argue that magnetic and charge modulation coexist in new thermodynamic phases. This leads to a rich diagram of equilibrium phases, qualitatively similar to those seen experimentally. The success of this model argues for a fundamental reinterpretation of the nature of charge modulation in these materials, from a localized to a more extended 'charge-density wave' picture. The same symmetry considerations that favour textured coexistence of charge and magnetic order may apply to many electronic systems with competing phases. The resulting 'electronically soft' phases of matter with incommensurate, inhomogeneous and mixed order may be general phenomena in correlated systems.

Fabrication and electric measurements of nanostructures inside transmission electron microscope.

Science.gov (United States)

Chen, Qing; Peng, Lian-Mao

2011-06-01

Using manipulation holders specially designed for transmission electron microscope (TEM), nanostructures can be characterized, measured, modified and even fabricated in-situ. In-situ TEM techniques not only enable real-time study of structure-property relationships of materials at atomic scale, but also provide the ability to control and manipulate materials and structures at nanoscale. This review highlights in-situ electric measurements and in-situ fabrication and structure modification using manipulation holder inside TEM. Copyright © 2011 Elsevier B.V. All rights reserved.

AIMgSil Alloy Characterization Using Transmission Electron Microscope (TEM)

International Nuclear Information System (INIS)

Masrukan; Elman, P.

1996-01-01

The aging alloy of AIMgSil containing Mg 2 Si of 1.29 % has been done with the following steps: e.q (a) part of the specimen was heated at 400 o C during 3 hours, and (b) the other part was done with solution treatment at 550 o C followed by quenching. After quenching a part of the specimen was aged at room temperature and other specimen was aged at 160 o C during 16 hours. After the specimen had been heated, then it was shaped into thin foil to be examined by Transmission Electron Microscope. The result showed that the heating at temperature of 400 o C during 3 hours created a second phase (i.e.Mg 2 Si) was like stick shape with the hexagonal structure at [0111] orientation and matrix [001], and the hardness was 31 HB. The aging of specimen at room temperature gave result a GP zone which was like the needles shape in the dislocation area of the face center cubic structure at [111] orientation and [111] matrix. The hardness obtained was 64 HB. In the other hand the aging process at temperature of 160 o C within 16 hours have resulted the precipitate which was greater than that of the former needle shaped as the face center cubic structure without dislocation at matrix with [111] orientation and [114] matrix. The hardness at this condition was 94 HB

Film thickness measurement based on nonlinear phase analysis using a Linnik microscopic white-light spectral interferometer.

Science.gov (United States)

Guo, Tong; Chen, Zhuo; Li, Minghui; Wu, Juhong; Fu, Xing; Hu, Xiaotang

2018-04-20

Based on white-light spectral interferometry and the Linnik microscopic interference configuration, the nonlinear phase components of the spectral interferometric signal were analyzed for film thickness measurement. The spectral interferometric signal was obtained using a Linnik microscopic white-light spectral interferometer, which includes the nonlinear phase components associated with the effective thickness, the nonlinear phase error caused by the double-objective lens, and the nonlinear phase of the thin film itself. To determine the influence of the effective thickness, a wavelength-correction method was proposed that converts the effective thickness into a constant value; the nonlinear phase caused by the effective thickness can then be determined and subtracted from the total nonlinear phase. A method for the extraction of the nonlinear phase error caused by the double-objective lens was also proposed. Accurate thickness measurement of a thin film can be achieved by fitting the nonlinear phase of the thin film after removal of the nonlinear phase caused by the effective thickness and by the nonlinear phase error caused by the double-objective lens. The experimental results demonstrated that both the wavelength-correction method and the extraction method for the nonlinear phase error caused by the double-objective lens improve the accuracy of film thickness measurements.

Use of an axisymmetric microscope with electronic readout for collecting soft X-ray images

International Nuclear Information System (INIS)

Cavailler, C.; Henry, P.; Launspach, J.; De Mascureau, J.; Millerioux, M.; Rostaing, M.; Sauneuf, R.

1984-08-01

The axisymmetric microscope, first discussed by Wolter, provides high resolution and sensitivity for investigating the soft X-ray emission of laser-driven plasmas. Such a device having a 10 X magnification has been constructed. We present a comparison between the images of laser-driven plasmas given by this microscope and by a 10 X pinhole camera. Until now these images were recorded on X-ray film. We have shown that film could be replaced by C.C.D. in a pinhole camera when the photon energy lies within the 1-10 keV range. Below 1 keV the quantum yield is too low so we have used an image converter tube made by RTC. It is a diode-inverter tube with a soft X-ray photocathode and a P20 phosphor deposited on an optic fiber plate. The electronic image appearing on the screen is read by a C.C.D. working in the visible spectral fields. An electronic image readout chain, which is identical to those associated with streak cameras, then processes automatically and immediately the images given by the microscope [fr

Nitrogen implantation with a scanning electron microscope.

Science.gov (United States)

Becker, S; Raatz, N; Jankuhn, St; John, R; Meijer, J

2018-01-08

Established techniques for ion implantation rely on technically advanced and costly machines like particle accelerators that only few research groups possess. We report here about a new and surprisingly simple ion implantation method that is based upon a widespread laboratory instrument: The scanning electron microscope. We show that it can be utilized to ionize atoms and molecules from the restgas by collisions with electrons of the beam and subsequently accelerate and implant them into an insulating sample by the effect of a potential building up at the sample surface. Our method is demonstrated by the implantation of nitrogen ions into diamond and their subsequent conversion to nitrogen vacancy centres which can be easily measured by fluorescence confocal microscopy. To provide evidence that the observed centres are truly generated in the way we describe, we supplied a 98% isotopically enriched 15 N gas to the chamber, whose natural abundance is very low. By employing the method of optically detected magnetic resonance, we were thus able to verify that the investigated centres are actually created from the 15 N isotopes. We also show that this method is compatible with lithography techniques using e-beam resist, as demonstrated by the implantation of lines using PMMA.

Micro-four-point probes in a UHV scanning electron microscope for in-situ surface-conductivity measurements

DEFF Research Database (Denmark)

Shiraki, I.; Nagao, T.; Hasegawa, S.

2000-01-01

For in-situ measurements of surface conductivity in ultrahigh vacuum (UHV), we have installed micro-four-point probes (probe spacings down to 4 mum) in a UHV scanning electron microscope (SEM) combined with scanning reflection-high-energy electron diffraction (RHEED). With the aid of piezoactuators...

In-situ straining and time-resolved electron tomography data acquisition in a transmission electron microscope.

Science.gov (United States)

Hata, S; Miyazaki, S; Gondo, T; Kawamoto, K; Horii, N; Sato, K; Furukawa, H; Kudo, H; Miyazaki, H; Murayama, M

2017-04-01

This paper reports the preliminary results of a new in-situ three-dimensional (3D) imaging system for observing plastic deformation behavior in a transmission electron microscope (TEM) as a directly relevant development of the recently reported straining-and-tomography holder [Sato K et al. (2015) Development of a novel straining holder for transmission electron microscopy compatible with single tilt-axis electron tomography. Microsc. 64: 369-375]. We designed an integrated system using the holder and newly developed straining and image-acquisition software and then developed an experimental procedure for in-situ straining and time-resolved electron tomography (ET) data acquisition. The software for image acquisition and 3D visualization was developed based on the commercially available ET software TEMographyTM. We achieved time-resolved 3D visualization of nanometer-scale plastic deformation behavior in a Pb-Sn alloy sample, thus demonstrating the capability of this system for potential applications in materials science. © The Author 2016. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oup.com.

Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope.

Science.gov (United States)

Wang, Peng; Behan, Gavin; Kirkland, Angus I; Nellist, Peter D; Cosgriff, Eireann C; D'Alfonso, Adrian J; Morgan, Andrew J; Allen, Leslie J; Hashimoto, Ayako; Takeguchi, Masaki; Mitsuishi, Kazutaka; Shimojo, Masayuki

2011-06-01

Scanning confocal electron microscopy (SCEM) offers a mechanism for three-dimensional imaging of materials, which makes use of the reduced depth of field in an aberration-corrected transmission electron microscope. The simplest configuration of SCEM is the bright-field mode. In this paper we present experimental data and simulations showing the form of bright-field SCEM images. We show that the depth dependence of the three-dimensional image can be explained in terms of two-dimensional images formed in the detector plane. For a crystalline sample, this so-called probe image is shown to be similar to a conventional diffraction pattern. Experimental results and simulations show how the diffracted probes in this image are elongated in thicker crystals and the use of this elongation to estimate sample thickness is explored. Copyright © 2010 Elsevier B.V. All rights reserved.

Scanning tunnelling microscope imaging of nanoscale electron density gradients on the surface of GaAs

International Nuclear Information System (INIS)

Hamilton, B; Jacobs, J; Missous, M

2003-01-01

This paper is concerned with the scanning tunnelling microscope tunnelling conditions needed to produce constant current images dominated either by surface topology or by electronic effects. A model experimental structure was produced by cleaving a GaAs multiδ-doped layer in UHV and so projecting a spatially varying electron gas density onto the (110) surface. This cross sectional electron density varies on a nanometre scale in the [100] growth direction. The electronic structure and tunnelling properties of this system were modelled, and the tunnelling conditions favouring sensitivity to the surface electron gas density determined

Radioactive and electron microscope analysis of effluent monitor sample lines

International Nuclear Information System (INIS)

Kowalski, J.F.

1986-01-01

Effluent air sampling at nuclear power plant often leads to the question ''How representative is the sample of the effluent stream?'' Samples from radiation monitors are typically obtained at great distances from the sample nozzle because of high background concerns under postulated accidents. Sample line plateout during normal effluent sampling becomes the major concern. A US Nuclear Regulatory Commission inspection raised a concern that monitors were not collecting representative samples per ANSI standard N13.1. A comprehensive 2-yr study at Beaver Valley was performed during normal effluent releases in two phases: 1) weekly charcoal and glass fiber filter samples were analyzed for radioactivity for 6 months, and 2) nuclepore membrane filter samples were analyzed by electron microscope for 4- and 6-h periods. A specially designed test nozzle was directly inserted into an effluent stream for comparison with the radiation monitor samples. Particle behavior characteristics can be determined during effluent releases using a simple test probe. While particle plateout was the major purpose of the study, other particle behavior characteristics were evident and equally as important. Particle travel through long sample lines can also lead to (a) agglomeration or the coagulation of smaller particles to form larger ones, (b) particle splitting or fracturing upon impact with the sample line interior walls, and (c) resuspension of large particles in sample lines

Light and electron microscopic localization of GABAA-receptors on cultured cerebellar granule cells and astrocytes using immunohistochemical techniques

DEFF Research Database (Denmark)

Hansen, Gert Helge; Hösli, E; Belhage, B

1991-01-01

. At the light microscope level specific staining of GABAA-receptors was localized in various types of neurones in explant cultures of rat cerebellum using the indirect peroxidase-antiperoxidase (PAP) technique, whereas no specific staining was found in astrocytes. At the electron microscope level labeling...

Method and apparatus for a high-resolution three dimensional confocal scanning transmission electron microscope

Science.gov (United States)

de Jonge, Niels [Oak Ridge, TN

2010-08-17

A confocal scanning transmission electron microscope which includes an electron illumination device providing an incident electron beam propagating in a direction defining a propagation axis, and a precision specimen scanning stage positioned along the propagation axis and movable in at least one direction transverse to the propagation axis. The precision specimen scanning stage is configured for positioning a specimen relative to the incident electron beam. A projector lens receives a transmitted electron beam transmitted through at least part of the specimen and focuses this transmitted beam onto an image plane, where the transmitted beam results from the specimen being illuminated by the incident electron beam. A detection system is placed approximately in the image plane.

Characterizing deformed ultrafine-grained and nanocrystalline materials using transmission Kikuchi diffraction in a scanning electron microscope

International Nuclear Information System (INIS)

Trimby, Patrick W.; Cao, Yang; Chen, Zibin; Han, Shuang; Hemker, Kevin J.; Lian, Jianshe; Liao, Xiaozhou; Rottmann, Paul; Samudrala, Saritha; Sun, Jingli; Wang, Jing Tao; Wheeler, John; Cairney, Julie M.

2014-01-01

Graphical abstract: -- Abstract: The recent development of transmission Kikuchi diffraction (TKD) in a scanning electron microscope enables fast, automated orientation mapping of electron transparent samples using standard electron backscatter diffraction (EBSD) hardware. TKD in a scanning electron microscope has significantly better spatial resolution than conventional EBSD, enabling routine characterization of nanocrystalline materials and allowing effective measurement of samples that have undergone severe plastic deformation. Combining TKD with energy dispersive X-ray spectroscopy (EDS) provides complementary chemical information, while a standard forescatter detector system below the EBSD detector can be used to generate dark field and oriented dark field images. Here we illustrate the application of this exciting new approach to a range of deformed, ultrafine grained and nanocrystalline samples, including duplex stainless steel, nanocrystalline copper and highly deformed titanium and nickel–cobalt. The results show that TKD combined with EDS is a highly effective and widely accessible tool for measuring key microstructural parameters at resolutions that are inaccessible using conventional EBSD

The measurement and calculation of the X-ray spatial resolution obtained in the analytical electron microscope

International Nuclear Information System (INIS)

Michael, J.R.; Williams, D.B.

1990-01-01

The X-ray microanalytical spatial resolution is determined experimentally in various analytical electron microscopes by measuring the degradation of an atomically discrete composition profile across an interphase interface in a thin-foil of Ni-Cr-Fe. The experimental spatial resolutions are then compared with calculated values. The calculated spatial resolutions are obtained by the mathematical convolution of the electron probe size with an assumed beam-broadening distribution and the single-scattering model of beam broadening. The probe size is measured directly from an image of the probe in a TEM/SETEM and indirectly from dark-field signal changes resulting from scanning the probe across the edge of an MgO crystal in a dedicated STEM. This study demonstrates the applicability of the convolution technique to the calculation of the microanalytical spatial resolution obtained in the analytical electron microscope. It is demonstrated that, contrary to popular opinion, the electron probe size has a major impact on the measured spatial resolution in foils < 150 nm thick. (author)

Modification of a scanning electron microscope to produce Smith-Purcell radiation

International Nuclear Information System (INIS)

Kapp, Oscar H.; Sun, Yin-e; Kim, Kwang-Je; Crewe, Albert V.

2004-01-01

We have modified a scanning electron microscope (SEM) in an attempt to produce a miniature free electron laser that can produce radiation in the far infrared region, which is difficult to obtain otherwise. This device is similar to the instrument studied by the Dartmouth group and functions on the basic principles first described by Smith and Purcell. The electron beam of the SEM is passed over a metal grating and should be capable of producing photons either in the spontaneous emission regime or in the superradiance regime if the electron beam is sufficiently bright. The instrument is capable of being continuously tuned by virtue of the period of the metal grating and the choice of accelerating voltage. The emitted Smith-Purcell photons exit the instrument via a polyethylene window and are detected by an infrared bolometer. Although we have obtained power levels exceeding nanowatts in the spontaneous emission regime, we have thus far not been able to detect a clear example of superradiance

Electron Microscopic Changes of Rabbit Retina after Chromovitrectomy Using Combined Dyes (Experimental Study

Directory of Open Access Journals (Sweden)

B. M. Aznabaev

2018-01-01

Full Text Available Purpose: to evaluate on experimental model electron-microscopic changes of rabbit retina after staining of the posterior eye segmentwith combined dyes based on Trypan blue and Brilliant blue G for the assessment of their safety. Methods. The study was performed onChinchilla breed rabbits. Combined dyes based on Trypan blue and Brilliant blue were used: MembraneBlue-Dual (DORC, Netherlandsand “Staining solution for ophthalmic surgery” (JCS “Optimedservis”, Russia. Standard three-port vitrectomy technique was used. After vitreous removal dyes were injected in vitreous cavity and exposed for 10 seconds and then removed. The vitreous cavity was filled by a balanced salt solution. An electron-microscopic evaluation was performed on 5, 14 and 30 days after surgery. Eyes were enucleated in 20 minutes after animal was killed by air embolization. Intact eyes were used as a control, all samples were prepared in same сonditions. The damage of the retina architectonics and the presence of intracellular inclusions were evaluated. Results. The staged character of pathomorphological changes was revealed. On the 5th day moderate edema and hydropic dystrophy of neurons were registered. On the 14th day, there was no negative dynamics. On day 30, the signs of edema and dystrophy of neurons practically disappeared, which may indicate a fundamental reversibility of the registered changes. Conclusion. Investigated dyes for staining intraocular structures based on Trypan blue and Brilliant blue did not cause significant histomorphological changes and toxic effects on retinal cell structures. Detected electron microscopic changes were insignificant, had reversible character and could be mostly caused by a surgical injury.

Phase-contrast versus off-axis illumination: is a more complex microscope always more powerful?

Czech Academy of Sciences Publication Activity Database

Hostounský, Z.; Pelc, Radek

2007-01-01

Roč. 31, č. 2 (2007), s. 232-235 ISSN 1043-4046 Institutional research plan: CEZ:AV0Z50200510 Keywords : microscope * relief contrast * phase contrast Subject RIV: BH - Optics, Masers, Lasers Impact factor: 0.984, year: 2007

Dark-field imaging based on post-processed electron backscatter diffraction patterns of bulk crystalline materials in a scanning electron microscope.

Science.gov (United States)

Brodusch, Nicolas; Demers, Hendrix; Gauvin, Raynald

2015-01-01

Dark-field (DF) images were acquired in the scanning electron microscope with an offline procedure based on electron backscatter diffraction (EBSD) patterns (EBSPs). These EBSD-DF images were generated by selecting a particular reflection on the electron backscatter diffraction pattern and by reporting the intensity of one or several pixels around this point at each pixel of the EBSD-DF image. Unlike previous studies, the diffraction information of the sample is the basis of the final image contrast with a pixel scale resolution at the EBSP providing DF imaging in the scanning electron microscope. The offline facility of this technique permits the selection of any diffraction condition available in the diffraction pattern and displaying the corresponding image. The high number of diffraction-based images available allows a better monitoring of deformation structures compared to electron channeling contrast imaging (ECCI) which is generally limited to a few images of the same area. This technique was applied to steel and iron specimens and showed its high capability in describing more rigorously the deformation structures around micro-hardness indents. Due to the offline relation between the reference EBSP and the EBSD-DF images, this new technique will undoubtedly greatly improve our knowledge of deformation mechanism and help to improve our understanding of the ECCI contrast mechanisms. Copyright © 2014 Elsevier B.V. All rights reserved.

Collaborative Research and Development. Delivery Order 0006: Transmission Electron Microscope Image Modeling and Semiconductor Heterointerface Characterization

National Research Council Canada - National Science Library

Mahalingam, Krishnamurthy

2006-01-01

.... Transmission electron microscope (TEM) characterization studies were performed on a variety of novel III-V semiconductor heterostructures being developed for advanced optoelectronic device applications...

Photocathode Optimization for a Dynamic Transmission Electron Microscope: Final Report

Energy Technology Data Exchange (ETDEWEB)

Ellis, P; Flom, Z; Heinselman, K; Nguyen, T; Tung, S; Haskell, R; Reed, B W; LaGrange, T

2011-08-04

The Dynamic Transmission Electron Microscope (DTEM) team at Harvey Mudd College has been sponsored by LLNL to design and build a test setup for optimizing the performance of the DTEM's electron source. Unlike a traditional TEM, the DTEM achieves much faster exposure times by using photoemission from a photocathode to produce electrons for imaging. The DTEM team's work is motivated by the need to improve the coherence and current density of the electron cloud produced by the electron gun in order to increase the image resolution and contrast achievable by DTEM. The photoemission test setup is nearly complete and the team will soon complete baseline tests of electron gun performance. The photoemission laser and high voltage power supply have been repaired; the optics path for relaying the laser to the photocathode has been finalized, assembled, and aligned; the internal setup of the vacuum chamber has been finalized and mostly implemented; and system control, synchronization, and data acquisition has been implemented in LabVIEW. Immediate future work includes determining a consistent alignment procedure to place the laser waist on the photocathode, and taking baseline performance measurements of the tantalum photocathode. Future research will examine the performance of the electron gun as a function of the photoemission laser profile, the photocathode material, and the geometry and voltages of the accelerating and focusing components in the electron gun. This report presents the team's progress and outlines the work that remains.

Scanning Electron Microscope Analysis System

Data.gov (United States)

Federal Laboratory Consortium — This facility provides the capability to examine surfaces microscopically with high resolution (5 nanometers), perform micro chemical analyses of these surfaces, and...

Examination of mycological samples by means of the scanning electron microscope

Directory of Open Access Journals (Sweden)

M. Thibaut

1973-04-01

Full Text Available Three species of Siphomycetes: Rhizopus arhizus, Rhizopus equinus and Rhizopus nigricans, as well as a Septomycete: Emericella nidulans, have been examined by means of a scanning electron microscope. Among the difjerent Rhizopus, this technique showed differences in the appearance of the sporangia. In Emericella nidulans, scanning microscopy enábled one to ascertain that the "Hull cells" were completely hollow and also demonstrated the ornemented aspect of the ascospores.

In Situ Room Temperature Electron-Beam Driven Graphene Growth from Hydrocarbon Contamination in a Transmission Electron Microscope

Directory of Open Access Journals (Sweden)

Mark H Rummeli

2018-05-01

Full Text Available The excitement of graphene (as well as 2D materials in general has generated numerous procedures for the fabrication of graphene. Here we present a mini-review on a rather less known, but attractive, in situ means to fabricate graphene inside a transmission electron microscope (TEM. This is achieved in a conventional TEM (viz. no sophisticated specimen holders or microscopes are required and takes advantage of inherent hydrocarbon contamination as a carbon source. Both catalyst free and single atom catalyst approaches are reviewed. An advantage of this technique is that not only can the growth process be imaged in situ, but this can also be achieved with atomic resolution. Moreover, in the future, one can anticipate such approaches enabling the growth of nano-materials with atomic precision.

Combined reflection and transmission microscope for telemedicine applications in field settings.

Science.gov (United States)

Biener, Gabriel; Greenbaum, Alon; Isikman, Serhan O; Lee, Kelvin; Tseng, Derek; Ozcan, Aydogan

2011-08-21

We demonstrate a field-portable upright and inverted microscope that can image specimens in both reflection and transmission modes. This compact and cost-effective dual-mode microscope weighs only ∼135 grams (image of the specimen onto an opto-electronic sensor-array that is positioned above the beam-splitter cube. In addition to this, the illumination beam is also partially transmitted through the same specimen, which then casts lensfree in-line holograms of the same objects onto a second opto-electronic sensor-array that is positioned underneath the beam-splitter cube. By rapid digital reconstruction of the acquired lensfree holograms, transmission images (both phase and amplitude) of the same specimen are also created. We tested the performance of this field-portable microscope by imaging various micro-particles, blood smears as well as a histopathology slide corresponding to skin tissue. Being compact, light-weight and cost-effective, this combined reflection and transmission microscope might especially be useful for telemedicine applications in resource limited settings. This journal is © The Royal Society of Chemistry 2011

Characteristics of different frequency ranges in scanning electron microscope images

International Nuclear Information System (INIS)

Sim, K. S.; Nia, M. E.; Tan, T. L.; Tso, C. P.; Ee, C. S.

2015-01-01

We demonstrate a new approach to characterize the frequency range in general scanning electron microscope (SEM) images. First, pure frequency images are generated from low frequency to high frequency, and then, the magnification of each type of frequency image is implemented. By comparing the edge percentage of the SEM image to the self-generated frequency images, we can define the frequency ranges of the SEM images. Characterization of frequency ranges of SEM images benefits further processing and analysis of those SEM images, such as in noise filtering and contrast enhancement

Characteristics of different frequency ranges in scanning electron microscope images

Energy Technology Data Exchange (ETDEWEB)

Sim, K. S., E-mail: kssim@mmu.edu.my; Nia, M. E.; Tan, T. L.; Tso, C. P.; Ee, C. S. [Faculty of Engineering and Technology, Multimedia University, 75450 Melaka (Malaysia)

2015-07-22

We demonstrate a new approach to characterize the frequency range in general scanning electron microscope (SEM) images. First, pure frequency images are generated from low frequency to high frequency, and then, the magnification of each type of frequency image is implemented. By comparing the edge percentage of the SEM image to the self-generated frequency images, we can define the frequency ranges of the SEM images. Characterization of frequency ranges of SEM images benefits further processing and analysis of those SEM images, such as in noise filtering and contrast enhancement.

Top-down topography of deeply etched silicon in the scanning electron microscope

International Nuclear Information System (INIS)

Wells, Oliver C.; Murray, Conal E.; Rullan, Jonathan L.; Gignac, Lynne M.

2004-01-01

It is proposed to measure the cross sections of steep-sided etched lines and similar deep surface topography on partially completed silicon integrated circuit wafers using either the backscattered electron (BSE) or the low-loss electron (LLE) image in the scanning electron microscope (SEM). These images contain regions where the collected signal is zero because there is no direct line of sight between the landing point of the electron beam on the specimen and the BSE or LLE detector. It is proposed to use the boundary of such a region in the SEM image as a geometrical line to measure the surface topography. Or alternatively, a shadow can be seen in the distribution of either BSE or LLE with an image-forming detector system. The use of this shadow position on the detector to measure deep surface topography will be demonstrated

Calibration for medium resolution off-axis electron holography using a flexible dual-lens imaging system in a JEOL ARM 200F microscope

International Nuclear Information System (INIS)

Cantu-Valle, Jesus; Ruiz-Zepeda, Francisco; Mendoza-Santoyo, Fernando; Jose-Yacaman, Miguel; Ponce, Arturo

2014-01-01

In this work the calibration of a medium resolution off-axis electron holography using a dual-lens imaging system in a JEOL ARM 200F is shown. The objective dual-lens configuration allows adjusting the field of view from 35 nm to 2.5 μm. Subsequently, the parameters used in phase shift reconstruction were calibrated considering biprism voltage versus fringe spacing (σ) and versus fringe width (W). The reliability of the transmission electron microscope performance using these parameters was achieved using gold nanoparticles of known size and adjusting the excitation voltage of the lenses. - Highlights: • We presented the off-axis electron holography calibration in dual-lens mode of a JEOL ARM 200F. • We provide optimal conditions for a wide field of views varying the objective lens excitation. • The calibration was made using Au-nanoparticles controlling fringe width, spacing and contrast. • Application of electron holography to nanoparticles is also shown

Mesotherapy for facial skin rejuvenation: a clinical, histologic, and electron microscopic evaluation.

Science.gov (United States)

Amin, Snehal P; Phelps, Robert G; Goldberg, David J

2006-12-01

Mesotherapy, as broadly defined, represents a variety of minimally invasive techniques in which medications are directly injected into the skin and underlying tissue in order to improve musculoskeletal, neurologic, and cosmetic conditions. There are few clinical studies evaluating the efficacy and safety of mesotherapy in any form. This study evaluates the histologic and clinical changes associated with one of the simplest formulations of mesotheraphy commonly used for skin rejuvenation. Ten subjects underwent four sessions of mesotherapy involving multiple injections of a multivitamin and hyaluronic acid solution. Treatment was conducted at 4 monthly intervals. All subjects had pre- and post-treatment photographs and skin biopsies. Skin biopsies were evaluated with routine histology, mucin and elastin stains, and electron microscopy. Patient surveys were also evaluated. Evaluation of photographs at 0, 3, and 6 months revealed no significant clinical differences. Light microscopic examination of pre- and posttreatment specimens showed no significant changes. Electron microscopic analysis of collagen fibers measurements did show smaller diameter fibres posttreatment. No significant clinical or histologic changes were observed after multivitamin mesotherapy for skin rejuvenation. Multivitamin and hyaluronic acid solution facial mesotherapy does not appear to provide any significant benefit.

Direct observation of phase transition of GeSbTe thin films by Atomic Force Microscope

Energy Technology Data Exchange (ETDEWEB)

Yang Fei [National Laboratory of Solid State Microstructures and Jiangsu Provincial Key Laboratory of Photonic and Electronic Materials Sciences and Technology, School of Electronic Science and Engineering, Nanjing University, Nanjing 210093 (China); Xu Ling, E-mail: xuling@nju.edu.cn [National Laboratory of Solid State Microstructures and Jiangsu Provincial Key Laboratory of Photonic and Electronic Materials Sciences and Technology, School of Electronic Science and Engineering, Nanjing University, Nanjing 210093 (China); Zhang Rui; Geng Lei; Tong Liang; Xu Jun [National Laboratory of Solid State Microstructures and Jiangsu Provincial Key Laboratory of Photonic and Electronic Materials Sciences and Technology, School of Electronic Science and Engineering, Nanjing University, Nanjing 210093 (China); Su Weining; Yu Yao [National Laboratory of Solid State Microstructures and Department of Physics, Nanjing University, Nanjing 210093 (China); Ma Zhongyuan; Chen Kunji [National Laboratory of Solid State Microstructures and Jiangsu Provincial Key Laboratory of Photonic and Electronic Materials Sciences and Technology, School of Electronic Science and Engineering, Nanjing University, Nanjing 210093 (China)

2012-10-01

Graphical abstract: Nano-sized marks on GST thin film were fabricated using Conductive-AFM (Atomic Force Microscope). The AFM morphology images show that the marks are ablated at the center and a raised ring surrounding it. Highlights: Black-Right-Pointing-Pointer Microstructure of GeSbTe thin films was characterized by XRD and AFM. Black-Right-Pointing-Pointer Annealing and applying electrical field can induce crystallization on thin film. Black-Right-Pointing-Pointer Conductive-AFM was used to modify the surface of GeSbTe thin film. - Abstract: GeSbTe (GST) thin films were deposited on quartz substrates using electron beam evaporation system and then annealed in nitrogen atmosphere at different temperatures, ranging from 20 Degree-Sign C to 300 Degree-Sign C. X-ray diffraction (XRD) and Atomic Force microscope (AFM) measurements were used to characterize the as-deposited and post-annealed thin films. Annealing treatment was found to induce changes on microstructure, surface roughness and grain size, indicating that with the increase of annealing temperature, the amorphous GST films first changed to face-centered-cubic (fcc) phase and then the stable hexagonal (hex) phase. Meanwhile, conductive-AFM (C-AFM) was used to produce crystallized GST dots on thin films. I-V spectroscopy results show that GST films can switch from amorphous state to crystalline state at threshold voltage. After switching, I-V curve exhibits ohmic characteristic, which is usually observed in crystallized GST films. By applying repeated I-V spectroscopies on the thin films, crystallized nuclei were observed. As the times of I-V spectroscopies increases, the area of written dots increases, and the center of the mark begin to ablate. The AFM images show that the shape of marks is an ablated center with a raised ring surrounding it.

Field Emission Scanning Electron Microscope (FESEM) Facility in BTI

International Nuclear Information System (INIS)

Cik Rohaida Che Hak; Foo, C.T.; Nor Azillah Fatimah Othman

2015-01-01

Field Emission Scanning Electron Microscope (FE-SEM) provides ultra-high resolution imaging at low accelerating voltages and small working distances. The GeminisSEM 500, a new FESEM imaging facility will be installed soon in MTEC, BTI. It provides resolution of the images is as low as 0.6 nm at 15 kV and 1.2 nm at 1 kV, allowing examination of the top surface of nano powders, nano film and nano fiber in the wide range of applications such as mineralogy, ceramics, polymer, metallurgy, electronic devices, chemistry, physics and life sciences. This system is equipped with several detectors to detect various signals such as secondary electrons (SE) detector for topographic information and back-scattered electrons (BSE) detector for materials composition contrast. Energy dispersive x-ray spectroscopy (EDS) with detector energy resolution of < 129 eV and detection limit in the range of 1000-3000 ppm coupled with FE-SEM is used to determine the chemical composition of micro-features including boron (B) to uranium (U). Wavelength dispersive x-ray spectroscopy (WDS) which has detector resolution of 2-20 eV and detection limit of 30-300 ppm coupled with FE-SEM is used to detect elements that cannot be resolved with EDS. The ultra-high resolution imaging combined with the high sensitivity WDS helps to resolve the thorium and rare earth elemental analysis. (author)

Simulation and Characterization of a Miniaturized Scanning Electron Microscope

Science.gov (United States)

Gaskin, Jessica A.; Jerman, Gregory A.; Medley, Stephanie; Gregory, Don; Abbott, Terry O.; Sampson, Allen R.

2011-01-01

A miniaturized Scanning Electron Microscope (mSEM) for in-situ lunar investigations is being developed at NASA Marshall Space Flight Center with colleagues from the University of Alabama in Huntsville (UAH), Advanced Research Systems (ARS), the University of Tennessee in Knoxville (UTK) and Case Western Reserve University (CWRU). This effort focuses on the characterization of individual components of the mSEM and simulation of the complete system. SEMs can provide information on the size, shape, morphology and chemical composition of lunar regolith. Understanding these basic properties will allow us to better estimate the challenges associated with In-Situ Resource Utilization and to improve our basic science knowledge of the lunar surface (either precluding the need for sample return or allowing differentiation of unique samples to be returned to Earth.) The main components of the mSEM prototype includes: a cold field emission electron gun (CFEG), focusing lens, deflection/scanning system and backscatter electron detector. Of these, the electron gun development is of particular importance as it dictates much of the design of the remaining components. A CFEG was chosen for use with the lunar mSEM as its emission does not depend on heating of the tungsten emitter (lower power), it offers a long operation lifetime, is orders of magnitude brighter than tungsten hairpin guns, has a small source size and exhibits low beam energy spread.

Electron microscopic identification of Zinga virus as a strain of Rift Valley fever virus.

Science.gov (United States)

Olaleye, O D; Baigent, C L; Mueller, G; Tomori, O; Schmitz, H

1992-01-01

Electron microscopic examination of a negatively stained suspension of Zinga virus showed particles 90-100 nm in diameter, enveloped with spikes 12-20 nm in length and 5 nm in diameter. Further identification of the virus by immune electron microscopy showed the reactivity of human Rift Valley fever virus-positive serum with Zinga virus. Results of this study are in agreement with earlier reports that Zinga virus is a strain of Rift Valley fever virus.

Design and commissioning of an aberration-corrected ultrafast spin-polarized low energy electron microscope with multiple electron sources.

Science.gov (United States)

Wan, Weishi; Yu, Lei; Zhu, Lin; Yang, Xiaodong; Wei, Zheng; Liu, Jefferson Zhe; Feng, Jun; Kunze, Kai; Schaff, Oliver; Tromp, Ruud; Tang, Wen-Xin

2017-03-01

We describe the design and commissioning of a novel aberration-corrected low energy electron microscope (AC-LEEM). A third magnetic prism array (MPA) is added to the standard AC-LEEM with two prism arrays, allowing the incorporation of an ultrafast spin-polarized electron source alongside the standard cold field emission electron source, without degrading spatial resolution. The high degree of symmetries of the AC-LEEM are utilized while we design the electron optics of the ultrafast spin-polarized electron source, so as to minimize the deleterious effect of time broadening, while maintaining full control of electron spin. A spatial resolution of 2nm and temporal resolution of 10ps (ps) are expected in the future time resolved aberration-corrected spin-polarized LEEM (TR-AC-SPLEEM). The commissioning of the three-prism AC-LEEM has been successfully finished with the cold field emission source, with a spatial resolution below 2nm. Copyright © 2017 Elsevier B.V. All rights reserved.

Selective scanning tunneling microscope light emission from rutile phase of VO2.

Science.gov (United States)

Sakai, Joe; Kuwahara, Masashi; Hotsuki, Masaki; Katano, Satoshi; Uehara, Yoichi

2016-09-28

We observed scanning tunneling microscope light emission (STM-LE) induced by a tunneling current at the gap between an Ag tip and a VO2 thin film, in parallel to scanning tunneling spectroscopy (STS) profiles. The 34 nm thick VO2 film grown on a rutile TiO2 (0 0 1) substrate consisted of both rutile (R)- and monoclinic (M)-structure phases of a few 10 nm-sized domains at room temperature. We found that STM-LE with a certain photon energy of 2.0 eV occurs selectively from R-phase domains of VO2, while no STM-LE was observed from M-phase. The mechanism of STM-LE from R-phase VO2 was determined to be an interband transition process rather than inverse photoemission or inelastic tunneling processes.

Phase zone plates as condensers for the Gottingen scanning x-ray microscope

International Nuclear Information System (INIS)

Hilkenbach, R.; Thieme

1987-01-01

With the Gottingen scanning x-ray microscope the synchrotron source is image by x-ray optics into a monochromatic small scan spot, through which a specimen can be moved. Hereby one part of the optics, the condenser zone plate and a pinhole, works as a linear monochromator in the wavelength region of λ = 2.36 nm to λ = 4.5 nm. The efficiency of such a condenser should be as high as possible to minimize the loss of radiation. Phase zone plates have a four times higher efficiency in the first order of diffraction than amplitude zone plates. Two condenser zone plates, KZP4 and KZP5, have been constructed so that they are well suited for the use in the scanning microscope. These zone plates have been made holographically by superposing two wavefronts of laser light in an specific designed optical arrangement and exposing the zone plate structure into a photoresist. Using reactive ion etching (RIE) the structure has been transformed into Germanium. The thickness of the zone plate has been chosen to show at λ = 2.36 nm a phase effect. The efficiency has been measured at the Berliner Elektronenspeircherring Gesellschaft fur Synchrotronstrahlung m.b.H., Berlin

The phase accumulation and antenna near field of microscopic propagating spin wave devices

Energy Technology Data Exchange (ETDEWEB)

Chang, Crosby S.; Kostylev, Mikhail, E-mail: mikhail.kostylev@uwa.edu.au; Ivanov, Eugene [School of Physics M013, The University of Western Australia, Crawley, WA 6009 (Australia); Ding, Junjia; Adeyeye, Adekunle O. [Department of Electrical and Computer Engineering, National University of Singapore, 117576 Singapore (Singapore)

2014-01-20

We studied phase accumulation by the highly non-reciprocal magnetostatic surface spin waves in thin Permalloy microstripes excited and received by microscopic coplanar antennae. We find that the experimentally measured characteristic length of the near field of the antenna is smaller than the total width of the coplanar. This is confirmed by our numerical simulations. Consequently, the distance over which the spin wave accumulates its phase while travelling between the input and output antennae coincides with the distance between the antennae symmetry axes with good accuracy.

The phase accumulation and antenna near field of microscopic propagating spin wave devices

International Nuclear Information System (INIS)

Chang, Crosby S.; Kostylev, Mikhail; Ivanov, Eugene; Ding, Junjia; Adeyeye, Adekunle O.

2014-01-01

We studied phase accumulation by the highly non-reciprocal magnetostatic surface spin waves in thin Permalloy microstripes excited and received by microscopic coplanar antennae. We find that the experimentally measured characteristic length of the near field of the antenna is smaller than the total width of the coplanar. This is confirmed by our numerical simulations. Consequently, the distance over which the spin wave accumulates its phase while travelling between the input and output antennae coincides with the distance between the antennae symmetry axes with good accuracy

Quantitative electron microscopical autoradiography of calcium during amelogenesis

International Nuclear Information System (INIS)

Nagai, Yoshinori; Frank, R.M.

1975-01-01

The migration of 45 Ca through the stratum intermedium and through the secreting ameloblasts towards enamel has been studied by electron microscopical autoradiography in the toothgerms of newborn cats. A quantitative procedure was applied to the study of the 45 Ca migration in amelogenesis and two pathways were demonstrated. The relatively more important direct route passed through the stratum intermedium and the ameloblast intercellular spaces and reached the enamel directly. The second pathway consisted of an intracellular migration through the ameloblast. 45 Ca penetrated the cell through its basal pole. The mitochondrias were the most highly labeled organelles at the different experimental time intervals studied. A total absence of silver grains was noted over the secretory ameloblastic bodies. At 6 hours, the highest labeling was observed over enamel. (auth.)

An aberration corrected photoemission electron microscope at the advanced light source

International Nuclear Information System (INIS)

Feng, J.; MacDowell, A.A.; Duarte, R.; Doran, A.; Forest, E.; Kelez, N.; Marcus, M.; Munson, D.; Padmore, H.; Petermann, K.; Raoux, S.; Robin, D.; Scholl, A.; Schlueter, R.; Schmid, P.; Stohr, J.; Wan, W.; Wei, D.H.; Wu, Y.

2003-01-01

Design of a new aberration corrected Photoemission electron microscope PEEM3 at the Advanced Light Source is outlined. PEEM3 will be installed on an elliptically polarized undulator beamline and will be used for the study of complex materials at high spatial and spectral resolution. The critical components of PEEM3 are the electron mirror aberration corrector and aberration-free magnetic beam separator. The models to calculate the optical properties of the electron mirror are discussed. The goal of the PEEM3 project is to achieve the highest possible transmission of the system at resolutions comparable to our present PEEM2 system (50 nm) and to enable significantly higher resolution, albeit at the sacrifice of intensity. We have left open the possibility to add an energy filter at a later date, if it becomes necessary driven by scientific need to improve the resolution further

Determination of the specific resistance of individual freestanding ZnO nanowires with the low energy electron point source microscope

Energy Technology Data Exchange (ETDEWEB)

Weber, Dirk Henning; Beyer, Andre; Voelkel, Berthold; Goelzhaeuser, Armin [Physik Supramolekularer Systeme, Universitaet Bielefeld (Germany); Schlenker, Eva; Bakin, Andrey; Waag, Andreas [Institut fuer Halbleitertechnik, Technische Universitaet Braunschweig (Germany)

2008-07-01

A low energy electron point source (LEEPS) microscope is used to determine the electrical conductivity of individual freestanding ZnO nanowires in UHV. The nanowires were contacted with a manipulation tip and I-V curves were taken at different wire lengths. From those, the specific resistance was calculated and separated from the contact resistance. By comparing the specific resistances of ZnO nanowires with diameters between 1100 and 48 nm, a large surface contribution for the thin nanowires was found. A geometric model for separation between surface and bulk contributions is given. The results of electrical transport measurements on vapor phase grown ZnO nanowires are discussed, as well as the size dependence of the wire resistance.

Distinction between amorphous and healed planar deformation features in shocked quartz using composite color scanning electron microscope cathodoluminescence (SEM-CL) imaging

Science.gov (United States)

Hamers, Maartje F.; Pennock, Gill M.; Herwegh, Marco; Drury, Martyn R.

2016-10-01

Planar deformation features (PDFs) in quartz are one of the most reliable and most widely used forms of evidence for hypervelocity impact. PDFs can be identified in scanning electron microscope cathodoluminescence (SEM-CL) images, but not all PDFs show the same CL behavior: there are nonluminescent and red luminescent PDFs. This study aims to explain the origin of the different CL emissions in PDFs. Focused ion beam (FIB) thin foils were prepared of specific sample locations selected in composite color SEM-CL images and were analyzed in a transmission electron microscope (TEM). The FIB preparation technique allowed a direct, often one-to-one correlation between the CL images and the defect structure observed in TEM. This correlation shows that composite color SEM-CL imaging allows distinction between amorphous PDFs on one hand and healed PDFs and basal Brazil twins on the other: nonluminescent PDFs are amorphous, while healed PDFs and basal Brazil twins are red luminescent, with a dominant emission peak at 650 nm. We suggest that the red luminescence is the result of preferential beam damage along dislocations, fluid inclusions, and twin boundaries. Furthermore, a high-pressure phase (possibly stishovite) in PDFs can be detected in color SEM-CL images by its blue luminescence.

Evolutionary developments in x ray and electron energy loss microanalysis instrumentation for the analytical electron microscope

Science.gov (United States)

Zaluzec, Nester J.

Developments in instrumentation for both X ray Dispersive and Electron Energy Loss Spectroscopy (XEDS/EELS) over the last ten years have given the experimentalist a greatly enhanced set of analytical tools for characterization. Microanalysts have waited for nearly two decades now in the hope of getting a true analytical microscope and the development of 300 to 400 kV instruments should have allowed us to attain this goal. Unfortunately, this has not generally been the case. While there have been some major improvements in the techniques, there has also been some devolution in the modern AEM (Analytical Electron Microscope). In XEDS, the majority of today's instruments are still plagued by the hole count effect, which was first described in detail over fifteen years ago. The magnitude of this problem can still reach the 20 percent level for medium atomic number species in a conventional off-the-shelf intermediate voltage AEM. This is an absurd situation and the manufacturers should be severely criticized. Part of the blame, however, also rests on the AEM community for not having come up with a universally agreed upon standard test procedure. Fortunately, such a test procedure is in the early stages of refinement. The proposed test specimen consists of an evaporated Cr film approx. 500 to 1000A thick supported upon a 3mm diameter Molybdenum 200 micron aperture.

The Scanning Electron Microscope As An Accelerator For The Undergraduate Advanced Physics Laboratory

International Nuclear Information System (INIS)

Peterson, Randolph S.; Berggren, Karl K.; Mondol, Mark

2011-01-01

Few universities or colleges have an accelerator for use with advanced physics laboratories, but many of these institutions have a scanning electron microscope (SEM) on site, often in the biology department. As an accelerator for the undergraduate, advanced physics laboratory, the SEM is an excellent substitute for an ion accelerator. Although there are no nuclear physics experiments that can be performed with a typical 30 kV SEM, there is an opportunity for experimental work on accelerator physics, atomic physics, electron-solid interactions, and the basics of modern e-beam lithography.

Cathodoluminescence of semiconductors in the scanning electron microscope

International Nuclear Information System (INIS)

Noriegas, Javier Piqueras de

2008-01-01

Full text: Cathodoluminescence (CL) in the scanning electron microscope (SEM) is a nondestructive technique, useful for characterization of optical and electronic properties of semiconductors, with spatial resolution. The contrast in the images of CL is related to the presence of crystalline defects, precipitates or impurities and provides information on their spatial distribution. CL spectra allows to study local energy position of localized electronic states. The application of the CL is extended to semiconductor very different characteristics, such as bulk material, heterostructures, nanocrystalline film, porous semiconductor, nanocrystals, nanowires and other nano-and microstructures. In the case of wafers, provides information on the homogeneity of their electronic characteristics, density of dislocations, grain sub frontiers, distribution of impurities and so on. while on the study of heterostructures CL images can determine, for example, the presence of misfit dislocations at the interface between different sheets, below the outer surface of the sample. In the study of other low dimensional structures, such as nanocrystalline films, nanoparticles and nano-and microstructures are observed elongated in some cases quantum confinement effects from the CL spectra. Moreover, larger structures, the order of hundreds of nanometers, with forms of wires, tubes or strips, is that in many semiconductor materials, mainly oxides, the behavior of luminescence is different from bulk material. The microstructures have a different structure of defects and a greater influence of the surface, which in some cases leads to a higher emission efficiency and a different spectral distribution. The presentation describes the principle of the CL technique and examples of its application in the characterization of a wide range of both semiconductor materials of different composition, and of different sizes ranging from nanostructures to bulk samples

Electron backscatter diffraction studies of focused ion beam induced phase transformation in cobalt

Energy Technology Data Exchange (ETDEWEB)

Jones, H.G., E-mail: helen.jones@npl.co.uk [National Physical Laboratory, Hampton Road, Teddington, Middlesex TW11 0LW (United Kingdom); Day, A.P. [Aunt Daisy Scientific Ltd, Claremont House, High St, Lydney GL15 5DX (United Kingdom); Cox, D.C. [National Physical Laboratory, Hampton Road, Teddington, Middlesex TW11 0LW (United Kingdom); Advanced Technology Institute, University of Surrey, Guildford GU2 7XH (United Kingdom)

2016-10-15

A focused ion beam microscope was used to induce cubic to hexagonal phase transformation in a cobalt alloy, of similar composition to that of the binder phase in a hardmetal, in a controlled manner at 0°, 45° and 80° ion incident angles. The cobalt had an average grain size of ~ 20 μm, allowing multiple orientations to be studied, exposed to a range of doses between 6 × 10{sup 7} and 2 × 10{sup 10} ions/μm{sup 2}. Electron backscatter diffraction (EBSD) was used to determine the original and induced phase orientations, and area fractions, before and after the ion beam exposure. On average, less phase transformation was observed at higher incident angles and after lower ion doses. However there was an orientation effect where grains with an orientation close to (111) planes were most susceptible to phase transformation, and (101) the least, where grains partially and fully transformed at varying ion doses. - Highlights: •Ion-induced phase change in FCC cobalt was observed at multiple incidence angles. •EBSD was used to study the relationship between grain orientation and transformation. •Custom software analysed ion dose and phase change with respect to grain orientation. •A predictive capability of ion-induced phase change in cobalt was enabled.

Development and application of a window-type environmental cell in high voltage electron microscope

International Nuclear Information System (INIS)

Wakasugi, Takenobu; Isobe, Shigehito; Umeda, Ayaka; Wang, Yongming; Hashimoto, Naoyuki; Ohnuki, Somei

2013-01-01

Highlights: ► A window-type environmental cell for a high voltage electron microscope (HVEM) is developed. ► In situ HVEM image of Pd under an H2 gas pressure is obtained. ► The effect of the window materials on the resolution and contamination of the HVEM image is tested. -- Abstract: A close type of an environmental cell was developed for a high voltage electron microscope. Using this cell allowed an in situ observation of hydrogenation in Pd particles under H 2 gas of 0.05 MPa at RT. Two types of window films, Tri-Acetyl-Cellulose (TAC) and Silicon Nitride (SiN), were used for testing the contamination on the sample, as well as the strength for pressure. We confirmed the hydrogenation in diffraction patterns and images, and additionally the image resolution of 0.19 nm was obtained by using a SiN film with a thickness of 17 nm

Electronic structure and microscopic model of CoNb2O6

Science.gov (United States)

Molla, Kaimujjaman; Rahaman, Badiur

2018-05-01

We present the first principle density functional calculations to figure out the underlying spin model of CoNb2O6. The first principles calculations define the main paths of superexchange interaction between Co spins in this compound. We discuss the nature of the exchange paths and provide quantitative estimates of magnetic exchange couplings. A microscopic modeling based on analysis of the electronic structure of this system puts it in the interesting class of weakly couple geometrically frustrated isosceles triangular Ising antiferromagnet.

Annular dark field electron microscope images with better than 2 A resolution at 100 kV

International Nuclear Information System (INIS)

Shin, D.H.; Kirkland, E.J.; Silcox, J.

1989-01-01

High-resolution scanning transmission electron microscope (STEM) images in the annular dark field (ADF) imaging mode approaching the theoretical point-to-point resolution limit are presented. The ADF images were obtained from a high T c superconducting YBa 2 Cu 3 O 7-x thin-film specimen at 100 kV. The 1.9 A resolution lattice image, which is the smallest lattice spacing in the specimen, corresponds to the minimum resolvable spatial frequency with 5% contrast in the contrast transfer function for annular dark field, and is smaller than the resolution limit given by the Rayleigh criterion. This demonstrates that STEM ADF imaging can have a resolution approximately 40% better than that of the bright field conventional transmission electron microscope (CTEM) imaging at Scherzer condition

Scanning electron microscope cathodoluminescence imaging of subgrain boundaries, twins and planar deformation features in quartz

Science.gov (United States)

Hamers, M. F.; Pennock, G. M.; Drury, M. R.

2017-04-01

The study of deformation features has been of great importance to determine deformation mechanisms in quartz. Relevant microstructures in both growth and deformation processes include dislocations, subgrains, subgrain boundaries, Brazil and Dauphiné twins and planar deformation features (PDFs). Dislocations and twin boundaries are most commonly imaged using a transmission electron microscope (TEM), because these cannot directly be observed using light microscopy, in contrast to PDFs. Here, we show that red-filtered cathodoluminescence imaging in a scanning electron microscope (SEM) is a useful method to visualise subgrain boundaries, Brazil and Dauphiné twin boundaries. Because standard petrographic thin sections can be studied in the SEM, the observed structures can be directly and easily correlated to light microscopy studies. In contrast to TEM preparation methods, SEM techniques are non-destructive to the area of interest on a petrographic thin section.

Observation of Magnetic Induction Distribution by Scanning Interference Electron Microscopy

Science.gov (United States)

Takahashi, Yoshio; Yajima, Yusuke; Ichikawa, Masakazu; Kuroda, Katsuhiro

1994-09-01

A scanning interference electron microscope (SIEM) capable of observing magnetic induction distribution with high sensitivity and spatial resolution has been developed. The SIEM uses a pair of fine coherent scanning probes and detects their relative phase change by magnetic induction, giving raster images of microscopic magnetic distributions. Its performance has been demonstrated by observing magnetic induction distributed near the edge of a recorded magnetic storage medium. Obtained images are compared with corresponding images taken in the scanning Lorentz electron microscope mode using the same microscope, and the differences between them are discussed.

Accurate virus quantitation using a Scanning Transmission Electron Microscopy (STEM) detector in a scanning electron microscope.

Science.gov (United States)

Blancett, Candace D; Fetterer, David P; Koistinen, Keith A; Morazzani, Elaine M; Monninger, Mitchell K; Piper, Ashley E; Kuehl, Kathleen A; Kearney, Brian J; Norris, Sarah L; Rossi, Cynthia A; Glass, Pamela J; Sun, Mei G

2017-10-01

A method for accurate quantitation of virus particles has long been sought, but a perfect method still eludes the scientific community. Electron Microscopy (EM) quantitation is a valuable technique because it provides direct morphology information and counts of all viral particles, whether or not they are infectious. In the past, EM negative stain quantitation methods have been cited as inaccurate, non-reproducible, and with detection limits that were too high to be useful. To improve accuracy and reproducibility, we have developed a method termed Scanning Transmission Electron Microscopy - Virus Quantitation (STEM-VQ), which simplifies sample preparation and uses a high throughput STEM detector in a Scanning Electron Microscope (SEM) coupled with commercially available software. In this paper, we demonstrate STEM-VQ with an alphavirus stock preparation to present the method's accuracy and reproducibility, including a comparison of STEM-VQ to viral plaque assay and the ViroCyt Virus Counter. Copyright © 2017 The Authors. Published by Elsevier B.V. All rights reserved.

Ultrastructural alterations in ciliary cells exposed to ionizing radiation. A scanning and transmission electron microscopic study

Energy Technology Data Exchange (ETDEWEB)

Baldetorp, L; Mecklenburg, C v; Haakansson, C H [Lund Univ. (Sweden). Hospital; Lund Univ. (Sweden). Dept. of Zoology)

1977-01-01

Early effects of ionizing radiation were investigated in an experimental in vitro system using the ciliary cells of the tracheal mucous membrane of the rabbit, irradiated at 30/sup 0/C and at more than 90% humidity. The changes in physiological activities of the ciliary cells caused by irradation were continously registered during the irradation. The specimens were examined immediately after irradiation electron microscopically. The morphological changes in irradiated material after 10-70 Gy are compared with normal material. After 40-70 Gy, scanning electron microscopy revealed the formation of vesicles on cilia, and club-like protrusions and adhesion of their tips. After 30-70 Gy, a swelling of mitochondrial membranes and cristae was apparent transmission electron microscopically. The membrane alterations caused by irradiation are assumed to disturb the permeability and flow of ATP from the mitochondria, which in turn leads to the recorded changes in the activity of the ciliated cells.

Tunneling rates in electron transport through double-barrier molecular junctions in a scanning tunneling microscope

OpenAIRE

Nazin, G. V.; Wu, S. W.; Ho, W.

2005-01-01

The scanning tunneling microscope enables atomic-scale measurements of electron transport through individual molecules. Copper phthalocyanine and magnesium porphine molecules adsorbed on a thin oxide film grown on the NiAl(110) surface were probed. The single-molecule junctions contained two tunneling barriers, vacuum gap, and oxide film. Differential conductance spectroscopy shows that electron transport occurs via vibronic states of the molecules. The intensity of spectral peaks correspondi...

Quantitative electron microscopical autoradiography of calcium during dentinogenesis

Energy Technology Data Exchange (ETDEWEB)

Nagai, Y [Tokyo Dental Coll. (Japan); Frank, R M

1975-03-01

/sup 45/Ca migration from the dental papilla and the odontablasts towards predentin and dentin has been studied through electron microscopical autoradiography in toothgerms of newborn cats. A quantitative procedure was applied to the study of the /sup 45/Ca migration in dentinogenesis. Two pathways of almost identical importance have been demonstrated. The direct pathway followed the intercellular spaces of the dental papilla and of the odontoblasts and reached the dentin via predentin. The second road, after passage through the intercellular spaces of the dental papilla, consisted of an intracellular migration through the odontoblast. The mitochondria and the golgi apparatus were progressively the most labelet at 5 min., 30 min. and 1 h. after intravenous injection. The calcium diffused into the odontablastic process without being associated with the dense granule. At 6 hours, maximum radioactivity was observed in the intertubular dentin.

Microscopic and histochemical manifestations of hyaline cartilage dynamics.

Science.gov (United States)

Malinin, G I; Malinin, T I

1999-01-01

Structure and function of hyaline cartilages has been the focus of many correlative studies for over a hundred years. Much of what is known regarding dynamics and function of cartilage constituents has been derived or inferred from biochemical and electron microscopic investigations. Here we show that in conjunction with ultrastructural, and high-magnification transmission light and polarization microscopy, the well-developed histochemical methods are indispensable for the analysis of cartilage dynamics. Microscopically demonstrable aspects of cartilage dynamics include, but are not limited to, formation of the intracellular liquid crystals, phase transitions of the extracellular matrix and tubular connections between chondrocytes. The role of the interchondrocytic liquid crystals is considered in terms of the tensegrity hypothesis and non-apoptotic cell death. Phase transitions of the extracellular matrix are discussed in terms of self-alignment of chondrons, matrix guidance pathways and cartilage growth in the absence of mitosis. The possible role of nonenzymatic glycation reactions in cartilage dynamics is also reviewed.

Magnetic lens apparatus for a low-voltage high-resolution electron microscope

Science.gov (United States)

Crewe, Albert V.

1996-01-01

A lens apparatus in which a beam of charged particles of low accelerating voltage is brought to a focus by a magnetic field, the lens being situated behind the target position. The lens comprises an electrically-conducting coil arranged around the axis of the beam and a magnetic pole piece extending along the axis of the beam at least within the space surrounded by the coil. The lens apparatus comprises the sole focusing lens for high-resolution imaging in a low-voltage scanning electron microscope.

Serotonergic synaptic input to facial motoneurons: localization by electron-microscopic autoradiography

Energy Technology Data Exchange (ETDEWEB)

Aghajanian, G K; McCall, R B [Yale Univ., New Haven, CT (USA). School of Medicine

1980-12-01

Serotonergic nerve terminals in the facial motor nucleus were labelled with (/sup 3/H)5-hydroxytryptamine. When serotonergic nerve terminals were destroyed (by the selective neurotoxin 5,7-dihydroxytryptamine) the labelling was lost. By electron-microscopic autoradiography, labelled serotonergic terminals were found to make axo-dendritic or axo-somatic junctions with facial motor neurons. No axo-axonic junctions were observed. These morphological findings are consistent with physiological studies which indicate that 5-hydroxytryptamine facilitates the excitation of facial motoneurons through a direct postsynaptic action.

A Transmission Electron Microscope Investigation of Space Weathering Effects in Hayabusa Samples

Science.gov (United States)

Keller, Lindsay P.; Berger, Eve L.

2014-01-01

The Hayabusa mission to asteroid 25143 Itokawa successfully returned the first direct samples of the regolith from the surface of an asteroid. The Hayabusa samples thus present a special opportunity to directly investigate the evolution of asteroidal surfaces, from the development of the regolith to the study of the more complex effects of space weathering. Here we describe the mineralogy, microstructure and composition of three Hayabusa mission particles using transmission electron microscope (TEM) techniques

Electron crystallography of organic pigments

International Nuclear Information System (INIS)

Boyce, G.

1997-10-01

The principle aim of this thesis is the detailing of the development and subsequent use of electron crystallographic techniques which employ the maximum entropy approach. An account is given of the electron microscope as a crystallographic instrument, along with the necessary theory involved. Also, an overview of the development of electron crystallography, as a whole, is given. This progresses to a description of the maximum entropy methodology and how use can be made of electron diffraction data in ab initio phasing techniques. Details are also given of the utilisation of image derived phases in the determination of structural information. Extensive examples are given of the use of the maximum entropy program MICE, as applied to a variety of structural problems. A particular area of interest covered by this thesis is regarding the solid state structure of organic pigments. A detailed structure review of both β-naphthol and acetoacetanilide pigments was undertaken. Information gained from this review was used as a starting point for the attempted structural elucidation of a related pigment, Barium Lake Red C. Details are given of the synthesis, electron microscope studies and subsequent ab initio phasing procedures applied in the determination of structural information on Barium Lake Red C. The final sections of this thesis detail electron crystallographic analyses of three quite different structures. Common to all was the use of maximum entropy methods, both for ab initio phasing and use of image derived phases. Overall, it is shown that electron crystallographic structure analyses using maximum entropy methods are successful using electron diffraction data and do provide distinct structural information even when significant perturbations to the data exist. (author)

The interperiosteo-dural concept applied to the perisellar compartment: a microanatomical and electron microscopic study.

Science.gov (United States)

François, Patrick; Travers, Nadine; Lescanne, Emmanuel; Arbeille, Brigitte; Jan, Michel; Velut, Stéphane

2010-11-01

The dura mater has 2 dural layers: the endosteal layer (outer layer), which is firmly attached to the bone, and the meningeal layer (inner layer), which directly covers the brain. These 2 dural layers join together in the middle temporal fossa or the convexity and separate into the orbital, lateral sellar compartment (LSC), or spinal epidural space to form the extradural neural axis compartment (EDNAC). The aim of this work was to anatomically verify the concept of the EDNAC by using electron microscopy. The authors studied the cadaveric heads obtained from 13 adults. Ten of the specimens (or 20 perisellar areas) were injected with colored latex and fixed in formalin. They carefully removed each brain to allow a superior approach to the perisellar area. The 3 other specimens were studied by microscopic and ultrastructural methods to describe the EDNAC in the perisellar area. Special attention was paid to the dural layers surrounding the perisellar area. The authors studied the anatomy of the meningeal architecture of the LSC, the petroclival venous confluence, the orbit, and the trigeminal cave. After dissection, the authors took photographs of the dural layers with the aid of optical magnification. The 3 remaining heads, obtained from fresh cadavers, were prepared for electron microscopic study. The EDNAC is limited by the endosteal layer and the meningeal layer and contains fat and/or venous blood. The endosteal layer and meningeal layer were not identical on electron microscopy; this finding can be readily related to the histology of the meninges. In this study, the authors demonstrated the existence of the EDNAC concept in the perisellar area by using dissected cadaveric heads and verified the reality of the concept of the meningeal layer with electron microscopy. These findings clearly demonstrated the existence of the EDNAC, a notion that has generally been accepted but never demonstrated microscopically.

Fabrication of optical multilayer for two-color phase plate in super-resolution microscope.

Science.gov (United States)

Iketaki, Yoshinori; Kitagawa, Katsuichi; Hidaka, Kohjiro; Kato, Naoki; Hirabayashi, Akira; Bokor, Nandor

2014-07-01

In super-resolution microscopy based on fluorescence depletion, the two-color phase plate (TPP) is an indispensable optical element, which can independently control the phase shifts for two beams of different color, i.e., the pump and erase beams. By controlling a phase shift of the erase beam through the TPP, the erase beam can be modulated into a doughnut shape, while the pump beam maintains the initial Gaussian shape. To obtain a reliable optical multiplayer (ML) for the TPP, we designed a ML with only two optical layers by performing numerical optimization. The measured phase shifts generated by the fabricated ML using interferometry correspond to the design values. The beam profiles in the focal plane are also consistent with theoretical results. Although the fabricated ML consists of only two optical layers, the ML can provide a suitable phase modulation function for the TPP in a practical super-resolution microscope.

Fabrication of optical multilayer for two-color phase plate in super-resolution microscope

International Nuclear Information System (INIS)

Iketaki, Yoshinori; Kitagawa, Katsuichi; Hidaka, Kohjiro; Kato, Naoki; Hirabayashi, Akira; Bokor, Nandor

2014-01-01

In super-resolution microscopy based on fluorescence depletion, the two-color phase plate (TPP) is an indispensable optical element, which can independently control the phase shifts for two beams of different color, i.e., the pump and erase beams. By controlling a phase shift of the erase beam through the TPP, the erase beam can be modulated into a doughnut shape, while the pump beam maintains the initial Gaussian shape. To obtain a reliable optical multiplayer (ML) for the TPP, we designed a ML with only two optical layers by performing numerical optimization. The measured phase shifts generated by the fabricated ML using interferometry correspond to the design values. The beam profiles in the focal plane are also consistent with theoretical results. Although the fabricated ML consists of only two optical layers, the ML can provide a suitable phase modulation function for the TPP in a practical super-resolution microscope

The Fresnel mode of Lorentz microscopy using a scanning transmission electron microscope

International Nuclear Information System (INIS)

Chapman, J.N.; Waddell, E.M.; Batson, P.E.; Ferrier, R.P.

1979-01-01

The most widely used method of investigating ferromagnetic films in the transmission electron microscope is the Fresnel or defocus mode of Lorentz microscopy. This may be implemented either in a fixed beam or a scanning instrument. Despite a rather inefficient utilization of electrons, several advantages accrue if the latter is used, and provided it is equipped with a field emission gun, low noise images may be obtained in acceptable recording times. To extract quantitative estimates of domain wall widths from such images it is necessary to measure accurately both instrumental and specimen parameters. Methods for this are discussed and an example of an analysis using a polycrystalline permalloy film is given. (Auth.)

Revealing the 1 nm/s Extensibility of Nanoscale Amorphous Carbon in a Scanning Electron Microscope

DEFF Research Database (Denmark)

Zhang, Wei

2013-01-01

In an ultra-high vacuum scanning electron microscope, the edged branches of amorphous carbon film (∼10 nm thickness) can be continuously extended with an eye-identifying speed (on the order of ∼1 nm/s) under electron beam. Such unusual mobility of amorphous carbon may be associated with deformation...... promoted by the electric field, which resulted from an inner secondary electron potential difference from the main trunk of carbon film to the tip end of branches under electron beam. This result demonstrates importance of applying electrical effects to modify properties of carbon materials. It may have...... positive implications to explore some amorphous carbon as electron field emission device. SCANNING 35: 261-264, 2013. © 2012 Wiley Periodicals, Inc....

Transmission electron microscopic method for gene mapping on polytene chromosomes by in situ hybridization

OpenAIRE

Wu, Madeline; Davidson, Norman

1981-01-01

A transmission electron microscope method for gene mapping by in situ hybridization to Drosophila polytene chromosomes has been developed. As electron-opaque labels, we use colloidal gold spheres having a diameter of 25 nm. The spheres are coated with a layer of protein to which Escherichia coli single-stranded DNA is photochemically crosslinked. Poly(dT) tails are added to the 3' OH ends of these DNA strands, and poly(dA) tails are added to the 3' OH ends of a fragmented cloned Drosophila DN...

Attainment of 40.5 pm spatial resolution using 300 kV scanning transmission electron microscope equipped with fifth-order aberration corrector.

Science.gov (United States)

Morishita, Shigeyuki; Ishikawa, Ryo; Kohno, Yuji; Sawada, Hidetaka; Shibata, Naoya; Ikuhara, Yuichi

2018-02-01

The achievement of a fine electron probe for high-resolution imaging in scanning transmission electron microscopy requires technological developments, especially in electron optics. For this purpose, we developed a microscope with a fifth-order aberration corrector that operates at 300 kV. The contrast flat region in an experimental Ronchigram, which indicates the aberration-free angle, was expanded to 70 mrad. By using a probe with convergence angle of 40 mrad in the scanning transmission electron microscope at 300 kV, we attained the spatial resolution of 40.5 pm, which is the projected interatomic distance between Ga-Ga atomic columns of GaN observed along [212] direction.

Electron microscopic study on SrGdMnO4

International Nuclear Information System (INIS)

Nakano, Hiromi; Ishizawa, Nobuo; Kamegashira, Naoki; Zulhadjri; Shishido, Toetsu

2006-01-01

Single crystals of SrGdMnO 4 have been synthesized by the floating zone method. The structure was characterized as the K 2 NiF 4 -type, using X-ray diffraction (XRD) and a transmission electron microscope (TEM). Presence of weak reflections breaking the archetypal tetragonal symmetry was observed from the selected area diffraction (SAD). The compound was found to have an orthorhombic unit cell of a ≅ b = 0.532(4) nm, c = 1.271(6) nm, by taking the a and b axes along the diagonal directions on the basal plane of the tetragonal archetype. Structural change occurred around 1018 K. The weak reflections disappeared in the SAD pattern, suggesting that crystal is of the archetype above 1018 K

Follicle and oocyte growth in early postnatal calves: cytochemical, autoradiographical and electron microscopical studies

International Nuclear Information System (INIS)

Mhawi, A.J.; Kaňka, J.; Motlík, J.

1991-01-01

The initiation of oocyte and follicle growth was studied in 1- and 3-d-old calf ovaries using cytochemical, autoradiographical and electron microscopical approaches. Attention was only paid to unilaminar ovarian follicles that were classified into 3 categories: unilaminar flattened (UF), unilaminar flatto-cuboidal (UFC) and unilaminar cuboidal (UC) ovarian follicles when the oocyte was surrounded by 1 layer of flattened, a mixture of flattened and cuboidal and entirely cuboidal follicle cells, respectively. Our findings suggested that oocytes within each of these follicle categories were in different developmental stages. Furthermore, electron microscopic observations revealed that early after birth, oocyte nuclei characteristic of diplotene configuration (aggregation of the nuclear chromatin into moderately electron-dense small patches and fibrillo-granular texture of the nucleolus) were encountered in 41% of the UF follicles. The rest of the UF as well as all of the UFC and UC follicles were found to contain dictyate oocytes in which the chromatin was highly decondensed and the nucleolus differentiated into fibrillar, fibrillo-granular and granular components. The present results also indicated that the complete transition of the surrounding follicle cells from flattened to cuboidal shape and the morphological changes of the oocyte endoplasmic reticulum and mitochondria were 2 complementary events essential for initiation of oocyte growth

Influence of cathode geometry on electron dynamics in an ultrafast electron microscope

Directory of Open Access Journals (Sweden)

Shaozheng Ji

2017-09-01

Full Text Available Efforts to understand matter at ever-increasing spatial and temporal resolutions have led to the development of instruments such as the ultrafast transmission electron microscope (UEM that can capture transient processes with combined nanometer and picosecond resolutions. However, analysis by UEM is often associated with extended acquisition times, mainly due to the limitations of the electron gun. Improvements are hampered by tradeoffs in realizing combinations of the conflicting objectives for source size, emittance, and energy and temporal dispersion. Fundamentally, the performance of the gun is a function of the cathode material, the gun and cathode geometry, and the local fields. Especially shank emission from a truncated tip cathode results in severe broadening effects and therefore such electrons must be filtered by applying a Wehnelt bias. Here we study the influence of the cathode geometry and the Wehnelt bias on the performance of a photoelectron gun in a thermionic configuration. We combine experimental analysis with finite element simulations tracing the paths of individual photoelectrons in the relevant 3D geometry. Specifically, we compare the performance of guard ring cathodes with no shank emission to conventional truncated tip geometries. We find that a guard ring cathode allows operation at minimum Wehnelt bias and improve the temporal resolution under realistic operation conditions in an UEM. At low bias, the Wehnelt exhibits stronger focus for guard ring than truncated tip cathodes. The increase in temporal spread with bias is mainly a result from a decrease in the accelerating field near the cathode surface. Furthermore, simulations reveal that the temporal dispersion is also influenced by the intrinsic angular distribution in the photoemission process and the initial energy spread. However, a smaller emission spot on the cathode is not a dominant driver for enhancing time resolution. Space charge induced temporal broadening

Influence of cathode geometry on electron dynamics in an ultrafast electron microscope.

Science.gov (United States)

Ji, Shaozheng; Piazza, Luca; Cao, Gaolong; Park, Sang Tae; Reed, Bryan W; Masiel, Daniel J; Weissenrieder, Jonas

2017-09-01

Efforts to understand matter at ever-increasing spatial and temporal resolutions have led to the development of instruments such as the ultrafast transmission electron microscope (UEM) that can capture transient processes with combined nanometer and picosecond resolutions. However, analysis by UEM is often associated with extended acquisition times, mainly due to the limitations of the electron gun. Improvements are hampered by tradeoffs in realizing combinations of the conflicting objectives for source size, emittance, and energy and temporal dispersion. Fundamentally, the performance of the gun is a function of the cathode material, the gun and cathode geometry, and the local fields. Especially shank emission from a truncated tip cathode results in severe broadening effects and therefore such electrons must be filtered by applying a Wehnelt bias. Here we study the influence of the cathode geometry and the Wehnelt bias on the performance of a photoelectron gun in a thermionic configuration. We combine experimental analysis with finite element simulations tracing the paths of individual photoelectrons in the relevant 3D geometry. Specifically, we compare the performance of guard ring cathodes with no shank emission to conventional truncated tip geometries. We find that a guard ring cathode allows operation at minimum Wehnelt bias and improve the temporal resolution under realistic operation conditions in an UEM. At low bias, the Wehnelt exhibits stronger focus for guard ring than truncated tip cathodes. The increase in temporal spread with bias is mainly a result from a decrease in the accelerating field near the cathode surface. Furthermore, simulations reveal that the temporal dispersion is also influenced by the intrinsic angular distribution in the photoemission process and the initial energy spread. However, a smaller emission spot on the cathode is not a dominant driver for enhancing time resolution. Space charge induced temporal broadening shows a close to

Observation of Phase Objects by Using an X-ray Microscope with a Foucault Knife-Edge

Science.gov (United States)

Watanabe, N.; Sasaya, T.; Imai, Y.; Iwata, S.; Zama, K.; Aoki, S.

2011-09-01

An x-ray microscope with a zone plate was assembled at the synchrotron radiation source of BL3C, Photon Factory. A Foucault knife-edge was set at the back focal plate of the objective zone plate and phase retrieval was tested by scanning the knife-edge. A preliminary result shows that scanning the knife-edge during exposure was effective for phase retrieval. Phase-contrast tomography was investigated using differential projection images calculated from two Schlieren images with the oppositely oriented knife-edges. Fairly good reconstruction images of polystyrene beads and spores could be obtained.

Observation of Phase Objects by Using an X-ray Microscope with a Foucault Knife-Edge

International Nuclear Information System (INIS)

Watanabe, N.; Sasaya, T.; Imai, Y.; Iwata, S.; Zama, K.; Aoki, S.

2011-01-01

An x-ray microscope with a zone plate was assembled at the synchrotron radiation source of BL3C, Photon Factory. A Foucault knife-edge was set at the back focal plate of the objective zone plate and phase retrieval was tested by scanning the knife-edge. A preliminary result shows that scanning the knife-edge during exposure was effective for phase retrieval. Phase-contrast tomography was investigated using differential projection images calculated from two Schlieren images with the oppositely oriented knife-edges. Fairly good reconstruction images of polystyrene beads and spores could be obtained.

Laser scanning confocal microscope with programmable amplitude, phase, and polarization of the illumination beam.

Science.gov (United States)

Boruah, B R; Neil, M A A

2009-01-01

We describe the design and construction of a laser scanning confocal microscope with programmable beam forming optics. The amplitude, phase, and polarization of the laser beam used in the microscope can be controlled in real time with the help of a liquid crystal spatial light modulator, acting as a computer generated hologram, in conjunction with a polarizing beam splitter and two right angled prisms assembly. Two scan mirrors, comprising an on-axis fast moving scan mirror for line scanning and an off-axis slow moving scan mirror for frame scanning, configured in a way to minimize the movement of the scanned beam over the pupil plane of the microscope objective, form the XY scan unit. The confocal system, that incorporates the programmable beam forming unit and the scan unit, has been implemented to image in both reflected and fluorescence light from the specimen. Efficiency of the system to programmably generate custom defined vector beams has been demonstrated by generating a bottle structured focal volume, which in fact is the overlap of two cross polarized beams, that can simultaneously improve both the lateral and axial resolutions if used as the de-excitation beam in a stimulated emission depletion confocal microscope.

Many-beam effects in electron microscope images of lattice defects

International Nuclear Information System (INIS)

Izui, Kazuhiko; Nishida, Takahiko; Furuno, Shigemi; Otsu, Hitoshi

1974-01-01

Multi-beam effects in electron microscopic images were investigated. A computation program was developed on the basis of a matrix theory of the multi-beam effects. The matrix theory for a perfect crystal and an imperfect crystal is described, and expression for absorption coefficient is presented. The amplitude of electron wave penetrating through lattice defects is expressed by using scattering matrices which correspond to crystal slices. Calculation of extinction distance was performed, and compared with experimental results. In case of systematic reflection, the difference between two beams and from four to eight beams approximation was small, while a large effect was seen in case of accidental reflection. The intensity profile of bend contour was calculated for silicon and copper-aluminum alloy. Distance between submaxima becomes short with increase of thickness. The change in stacking fault fringes with diffraction condition was investigated. Samples were copper-aluminum alloy. Systematic behavior of the fringes was obtained, and the calculated results reproduced experimental ones. (Kato, T.)

High frequency write head measurement with the phase detection magnetic force microscope

International Nuclear Information System (INIS)

Abe, M.; Tanaka, Y.

2001-01-01

We demonstrated the measurement of the high frequency (HF) magnetic field of a write head with the phase detection magnetic force microscope. An amplitude-modulated current was applied to the head coil to detect the force gradient induced by the HF magnetic field. Spatial resolution of this method was higher than that of the deflection detection method previously proposed. By the phase detection method, dynamic HF magnetic fields at the poles of the write heads were clearly imaged. HF magnetic field leakage was observed along the P2 pole shape on the air-bearing surface. The frequency dependence of the write head dynamics up to 350 MHz was also investigated. [copyright] 2001 American Institute of Physics

A monochromatic, aberration-corrected, dual-beam low energy electron microscope.

Science.gov (United States)

Mankos, Marian; Shadman, Khashayar

2013-07-01

The monochromatic, aberration-corrected, dual-beam low energy electron microscope (MAD-LEEM) is a novel instrument aimed at imaging of nanostructures and surfaces at sub-nanometer resolution that includes a monochromator, aberration corrector and dual beam illumination. The monochromator reduces the energy spread of the illuminating electron beam, which significantly improves spectroscopic and spatial resolution. The aberration corrector utilizes an electron mirror with negative aberrations that can be used to compensate the aberrations of the LEEM objective lens for a range of electron energies. Dual flood illumination eliminates charging generated when a conventional LEEM is used to image insulating specimens. MAD-LEEM is designed for the purpose of imaging biological and insulating specimens, which are difficult to image with conventional LEEM, Low-Voltage SEM, and TEM instruments. The MAD-LEEM instrument can also be used as a general purpose LEEM with significantly improved resolution. The low impact energy of the electrons is critical for avoiding beam damage, as high energy electrons with keV kinetic energies used in SEMs and TEMs cause irreversible change to many specimens, in particular biological materials. A potential application for MAD-LEEM is in DNA sequencing, which demands imaging techniques that enable DNA sequencing at high resolution and speed, and at low cost. The key advantages of the MAD-LEEM approach for this application are the low electron impact energies, the long read lengths, and the absence of heavy-atom DNA labeling. Image contrast simulations of the detectability of individual nucleotides in a DNA strand have been developed in order to refine the optics blur and DNA base contrast requirements for this application. Copyright © 2013 Elsevier B.V. All rights reserved.

The QCD phase transition. From the microscopic mechanism to signals

International Nuclear Information System (INIS)

Shuryak, E.V.

1997-01-01

This talk consists of two very different parts: the first one deals with non-perturbative QCD and physics of the chiral restoration, the second with rather low-key (and still unfinished) work aiming at obtaining EOS and other properties of hot/dense hadronic matter from data on heavy ion collisions. The microscopic mechanism for chiral restoration phase transition is a transition from randomly placed tunneling events (instantons) at low T to a set of strongly correlated tunneling-anti-tunneling events (known as instanton-anti-instanton molecules) at high T. Many features of the transition can be explained in this simple picture, especially the critical line and its dependence on quark masses. This scenario predicts qualitative change of the basic quark-quark interactions around the phase transition line, with some states (such as pion-sigma ones) probably surviving event at T > T c . In the second half of the talk experimental data on collective flow in heavy ion collision are discussed its hydro-based description and relation to equation of state (EOS). A distinct feature of the QCD phase transition region is high degree of 'softness', (small ratio pressure/energy density). (author)

In situ measurement of the kinetic friction of ZnO nanowires inside a scanning electron microscope

Energy Technology Data Exchange (ETDEWEB)

Polyakov, Boris, E-mail: boriss.polakovs@ut.ee [Institute of Physics, University of Tartu, Riia st. 142, Tartu (Estonia); Institute of Solid State Physics, University of Latvia, Kengaraga st. 8, Riga (Latvia); Dorogin, Leonid M; Lohmus, Ants [Institute of Physics, University of Tartu, Riia st. 142, Tartu (Estonia); Romanov, Alexey E [Institute of Physics, University of Tartu, Riia st. 142, Tartu (Estonia); Ioffe Physical Technical Institute, RAS, Politehnicheskaja st. 26, St. Petersburg (Russian Federation); Lohmus, Rynno [Institute of Physics, University of Tartu, Riia st. 142, Tartu (Estonia)

2012-01-15

A novel method for measuring the kinetic friction force in situ was developed for zinc oxide nanowires on highly oriented pyrolytic graphite and oxidised silicon wafers. The experiments were performed inside a scanning electron microscope and used a nanomanipulation device as an actuator, which also had an atomic force microscope tip attached to it as a probe. A simple model based on the Timoshenko elastic beam theory was applied to interpret the elastic deformation of a sliding nanowire (NW) and to determine the distributed kinetic friction force.

Electronic phase transitions

CERN Document Server

Kopaev, YuV

1992-01-01

Electronic Phase Transitions deals with topics, which are presently at the forefront of scientific research in modern solid-state theory. Anderson localization, which has fundamental implications in many areas of solid-state physics as well as spin glasses, with its influence on quite different research activities such as neural networks, are two examples that are reviewed in this book. The ab initio statistical mechanics of structural phase transitions is another prime example, where the interplay and connection of two unrelated disciplines of solid-state theory - first principle ele

The objective lens of the electron microscope with correction of spherical and axial chromatic aberrations.

Science.gov (United States)

Bimurzaev, S B; Aldiyarov, N U; Yakushev, E M

2017-10-01

The paper describes the principle of operation of a relatively simple aberration corrector for the transmission electron microscope objective lens. The electron-optical system of the aberration corrector consists of the two main elements: an electrostatic mirror with rotational symmetry and a magnetic deflector formed by the round-shaped magnetic poles. The corrector operation is demonstrated by calculations on the example of correction of basic aberrations of the well-known objective lens with a bell-shaped distribution of the axial magnetic field. Two of the simplest versions of the corrector are considered: a corrector with a two-electrode electrostatic mirror and a corrector with a three-electrode electrostatic mirror. It is shown that using the two-electrode mirror one can eliminate either spherical or chromatic aberration of the objective lens, without changing the value of its linear magnification. Using a three-electrode mirror, it is possible to eliminate spherical and chromatic aberrations of the objective lens simultaneously, which is especially important in designing electron microscopes with extremely high resolution. © The Author 2017. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oup.com.

Biological applications of phase-contrast electron microscopy.

Science.gov (United States)

Nagayama, Kuniaki

2014-01-01

Here, I review the principles and applications of phase-contrast electron microscopy using phase plates. First, I develop the principle of phase contrast based on a minimal model of microscopy, introducing a double Fourier-transform process to mathematically formulate the image formation. Next, I explain four phase-contrast (PC) schemes, defocus PC, Zernike PC, Hilbert differential contrast, and schlieren optics, as image-filtering processes in the context of the minimal model, with particular emphases on the Zernike PC and corresponding Zernike phase plates. Finally, I review applications of Zernike PC cryo-electron microscopy to biological systems such as protein molecules, virus particles, and cells, including single-particle analysis to delineate three-dimensional (3D) structures of protein and virus particles and cryo-electron tomography to reconstruct 3D images of complex protein systems and cells.

Transmission electron-microscopic studies of structural changes in polycrystalline graphite after high temperature irradiation

International Nuclear Information System (INIS)

Platonov, P.A.; Gurovich, B.A.; Shtrombakh, Ya.I.; Karpukhin, V.I.

1985-01-01

Transmission electron-microscopic investigation of polycrystalline graphite before and after irradiation is carried out. The direct use of graphite samples after ion thinning, as an inquiry subject is the basic peculiarity of the work. Main structural components of MPG-6 graphite before and after irradiation are revealed, the structural mechanism of the reactor graphite destruction under irradiation is demonstrated. The mean values of L αm and L cm crystallite dimensions are determined. Radiation defects, occuring in some crystallites after irradiation are revealed by the dark-field electron microscopy method

Design of Pixellated CMOS Photon Detector for Secondary Electron Detection in the Scanning Electron Microscope

Directory of Open Access Journals (Sweden)

Joon Huang Chuah

2011-01-01

Full Text Available This paper presents a novel method of detecting secondary electrons generated in the scanning electron microscope (SEM. The method suggests that the photomultiplier tube (PMT, traditionally used in the Everhart-Thornley (ET detector, is to be replaced with a configurable multipixel solid-state photon detector offering the advantages of smaller dimension, lower supply voltage and power requirements, and potentially cheaper product cost. The design of the proposed detector has been implemented using a standard 0.35 μm CMOS technology with optical enhancement. This microchip comprises main circuit constituents of an array of photodiodes connecting to respective noise-optimised transimpedance amplifiers (TIAs, a selector-combiner (SC circuit, and a postamplifier (PA. The design possesses the capability of detecting photons with low input optical power in the range of 1 nW with 100 μm × 100 μm sized photodiodes and achieves a total amplification of 180 dBΩ at the output.

Electron microscopic study of the spilt irradiation effects on the rat parotid ductal cells

International Nuclear Information System (INIS)

Kim, Sung Soo; Lee, Sang Rae

1988-01-01

This study was designed to investigate the effects of split irradiation on the salivary ductal cells, especially on the intercalated cells of the rat parotid glands. For this study, 24 Sprague-Dawley strain rats were irradiated on the head and neck region with two equal split doses of 9 Gy for a 4 hours interval by Co-60 teletherapy unit, Picker's mode l 4M 60. The conditions of irradiation were that field size, dose rate, SSD and depth were 12 X 5 cm, 222 cGy/min, 50 cm and 1 cm, respectively. The experimental animals were sacrificed 1, 2, 3, 6, 12, hours and 1, 3, 7, days after the irradiation and the changes of the irradiated intercalated cells of the parotid glands were examined under light and electron microscope. The results were as follows: 1. By the split irradiation, the degenerative changes of intercalated cells of the parotid glands appeared at 3 hours after irradiation and the most severe cellular degeneration observed at 6 hours after irradiation. The repair processes began from 12 hours after irradiation and have matured progressively. 2. Under electron microscope, loss of nuclear membrane, microvilli and secretory granules, derangement of chromosomes, degeneration of cytoplasm, atrophy or reduction of intracytoplasmic organelles were observed in the intercalated ductal cells after split irradiation. 3. Under light microscope, derangement of ductal cells, widening of cytoplasms and nuclei, hyperchromatism and proliferation of ductal cells were observed in intercalated ducts after split irradiation.

Bottlenecks in bog pine multiplication by somatic embryogenesis and their visualization with the environmental scanning electron microscope

Czech Academy of Sciences Publication Activity Database

Vlašínová, H.; Neděla, Vilém; Dordevic, B.; Havel, J.

2017-01-01

Roč. 254, č. 4 (2017), s. 1487-1497 ISSN 0033-183X R&D Projects: GA ČR(CZ) GA14-22777S Institutional support: RVO:68081731 Keywords : somatic embryogenesis * pinus uncinata subsp uliginosa * abnormalities * environmental scanning electron microscope Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering OBOR OECD: Plant sciences, botany Impact factor: 2.870, year: 2016

Electron microscope autoradiographic studies of the erythroblasts of a case of congenital dyserythropoietic anaemia, type II

Energy Technology Data Exchange (ETDEWEB)

Wickramasinghe, S N [Saint Mary' s Hospital Medical School, London (UK); Parry, T E [Department of Haematology, Llandough Hospital, Penarth, Glamorgan, Wales; Hughes, M [Division of Experimental Pathology, The Mathilda and Terence Kennedy Institute of Rheumatology, Bute Gardens, London, England

1978-01-01

The bone marrow cells of a patient with congenital dyserythropoietic anaemia, type II, were incubated with /sup 3/H-thymidine /sup 3/H-uridine or /sup 3/H-leucine for 1 h and studied using the technique of electron microscope autoradiography. Several of the erythroblasts which either displayed the characteristic subsurface double membranes or showed various non-specific abnormalities of the nuclear membrane were found to be actively engaged in DNA, RNA and protein synthesis. Both members of some pairs of erythroblasts which were joined together by a spindle bridge were found to be engaged in DNA synthesis, indicating that some spindle bridges persist for a period longer than the duration of the G/sub 1/ phase. A small proportion of mononucleate and binucleate late (non-dividing) erythroblasts showed a marked depression or arrest of protein synthesis and some or all of such cells were presumably destined to be phagocytosed by the bone marrow macrophages.

Identification of dorsal root synaptic terminals on monkey ventral horn cells by electron microscopic autoradiography

International Nuclear Information System (INIS)

Ralston, H.J.; Ralston, D.D.

1979-01-01

The projection of dorsal root fibres to the motor nucleus of the macaque monkey spinal cord has been examined utilizing light and electron microscopic autoradiography. Light microscopy demonstrates a very sparse labelling of primary afferent fibres in the ventral horn. Silver grains overlying radioactive sources are frequently clustered into small groups, often adjacent to dendritic profiles. Under the electron microscope, myelinated axons and a few large synaptic profiles containing rounded synaptic vesicles were overlain by numerous silver grains. These labelled profiles made synaptic contact with dendrites 1 - 3 micrometers in diameter. The labelled profiles did not contact cell bodies or large proximal dendrites of ventral horn neutrons. Frequently, small synaptic profiles containing flattened vesicles were presynaptic to the large labelled terminals and it is suggested that these axoaxonal synapses may mediate presynaptic inhibition of the primary afferent fibres. The relationship of the present findings to previously published physiological and anatomical studies is discussed. (author)

Imaging nanoscale spatial modulation of a relativistic electron beam with a MeV ultrafast electron microscope

Science.gov (United States)

Lu, Chao; Jiang, Tao; Liu, Shengguang; Wang, Rui; Zhao, Lingrong; Zhu, Pengfei; Liu, Yaqi; Xu, Jun; Yu, Dapeng; Wan, Weishi; Zhu, Yimei; Xiang, Dao; Zhang, Jie

2018-03-01

An accelerator-based MeV ultrafast electron microscope (MUEM) has been proposed as a promising tool to the study structural dynamics at the nanometer spatial scale and the picosecond temporal scale. Here, we report experimental tests of a prototype MUEM where high quality images with nanoscale fine structures were recorded with a pulsed ˜3 MeV picosecond electron beam. The temporal and spatial resolutions of the MUEM operating in the single-shot mode are about 4 ps (FWHM) and 100 nm (FWHM), corresponding to a temporal-spatial resolution of 4 × 10-19 s m, about 2 orders of magnitude higher than that achieved with state-of-the-art single-shot keV UEM. Using this instrument, we offer the demonstration of visualizing the nanoscale periodic spatial modulation of an electron beam, which may be converted into longitudinal density modulation through emittance exchange to enable production of high-power coherent radiation at short wavelengths. Our results mark a great step towards single-shot nanometer-resolution MUEMs and compact intense x-ray sources that may have widespread applications in many areas of science.

Atomic imaging using secondary electrons in a scanning transmission electron microscope: experimental observations and possible mechanisms.

Science.gov (United States)

Inada, H; Su, D; Egerton, R F; Konno, M; Wu, L; Ciston, J; Wall, J; Zhu, Y

2011-06-01

We report detailed investigation of high-resolution imaging using secondary electrons (SE) with a sub-nanometer probe in an aberration-corrected transmission electron microscope, Hitachi HD2700C. This instrument also allows us to acquire the corresponding annular dark-field (ADF) images both simultaneously and separately. We demonstrate that atomic SE imaging is achievable for a wide range of elements, from uranium to carbon. Using the ADF images as a reference, we studied the SE image intensity and contrast as functions of applied bias, atomic number, crystal tilt, and thickness to shed light on the origin of the unexpected ultrahigh resolution in SE imaging. We have also demonstrated that the SE signal is sensitive to the terminating species at a crystal surface. A possible mechanism for atomic-scale SE imaging is proposed. The ability to image both the surface and bulk of a sample at atomic-scale is unprecedented, and can have important applications in the field of electron microscopy and materials characterization. Copyright © 2010 Elsevier B.V. All rights reserved.

Accumulation of enriched uranium UO2F2 in ultrastructure as studied by electron microscopic autoradiography

International Nuclear Information System (INIS)

Zhu Shoupeng; Wang Yuanchang

1992-01-01

A study was made on the retention of soluble enriched uranium UO 2 F 2 in ultrastructure by electron microscopic autoradiography. The early dynamic accumulation of radioactivity in the body showed that enriched uranium UO 2 F 2 was mainly localized in kidneys, especially accumulated in epithelial cells of proximal convoluted tubules leading to degeneration and necrosis of the tubules. In liver cells, enriched uranium UO 2 F 2 at first deposited in nuclei of the cells and in soluble proteins of the plasma, and later accumulated selectively in mitochondria and lysosomes. On electron microscopic autoradiographic study it was shown that the dynamic retention of radioactivity of enriched uranium UO 2 F 2 in skeleton increased steadily through the time period of exposure. Enriched uranium UO 2 F 2 chiefly deposited in nuclei and mitochondria of osteoblasts as well as of osteoclasts

Practical application of HgI2 detectors to a space-flight scanning electron microscope

Science.gov (United States)

Bradley, J. G.; Conley, J. M.; Albee, A. L.; Iwanczyk, J. S.; Dabrowski, A. J.

1989-01-01

Mercuric iodide X-ray detectors have been undergoing tests in a prototype scanning electron microscope system being developed for unmanned space flight. The detector program addresses the issues of geometric configuration in the SEM, compact packaging that includes separate thermoelectric coolers for the detector and FET, X-ray transparent hermetic encapsulation and electrical contacts, and a clean vacuum environment.

About the contrast of δ' precipitates in bulk Al-Cu-Li alloys in reflection mode with a field-emission scanning electron microscope at low accelerating voltage.

Science.gov (United States)

Brodusch, Nicolas; Voisard, Frédéric; Gauvin, Raynald

2017-11-01

Characterising the impact of lithium additions in the precipitation sequence in Al-Li-Cu alloys is important to control the strengthening of the final material. Since now, transmission electron microscopy (TEM) at high beam voltage has been the technique of choice to monitor the size and spatial distribution of δ' precipitates (Al 3 Li). Here we report on the imaging of the δ' phase in such alloys using backscattered electrons (BSE) and low accelerating voltage in a high-resolution field-emission scanning electron microscope. By applying low-energy Ar + ion milling to the surface after mechanical polishing (MP), the MP-induced corroded layers were efficiently removed and permitted the δ's to be visible with a limited impact on the observed microstructure. The resulting BSE contrast between the δ's and the Al matrix was compared with that obtained using Monte Carlo modelling. The artefacts possibly resulting from the sample preparation procedure were reviewed and discussed and permitted to confirm that these precipitates were effectively the metastable δ's. The method described in this report necessitates less intensive sample preparation than that required for TEM and provides a much larger field of view and an easily interpretable contrast compared to the transmission techniques. © 2017 The Authors Journal of Microscopy © 2017 Royal Microscopical Society.

SEM analysis of ionizing radiation effects in linear integrated circuits. [Scanning Electron Microscope

Science.gov (United States)

Stanley, A. G.; Gauthier, M. K.

1977-01-01

A successful diagnostic technique was developed using a scanning electron microscope (SEM) as a precision tool to determine ionization effects in integrated circuits. Previous SEM methods radiated the entire semiconductor chip or major areas. The large area exposure methods do not reveal the exact components which are sensitive to radiation. To locate these sensitive components a new method was developed, which consisted in successively irradiating selected components on the device chip with equal doses of electrons /10 to the 6th rad (Si)/, while the whole device was subjected to representative bias conditions. A suitable device parameter was measured in situ after each successive irradiation with the beam off.

The Wavelength-Dispersive Spectrometer and Its Proposed Use in the Analytical Electron Microscope

Science.gov (United States)

Goldstein, Joseph I.; Lyman, Charles E.; Williams, David B.

1989-01-01

The Analytical Electron Microscope (AEM) equipped with a wavelength-dispersive spectrometer (WDS) should have the ability to resolve peaks which normally overlap in the spectra from an energy-dispersive spectrometer (EDS). With a WDS it should also be possible to measure lower concentrations of elements in thin foils due to the increased peak-to-background ratio compared with EDS. The WDS will measure X-ray from the light elements (4 less than Z less than 1O) more effectively. This paper addresses the possibility of interfacing a compact WDS with a focussing circle of approximately 4 cm to a modem AEM with a high-brightness (field emission) source of electrons.

Solving Research Tasks Using Desk top Scanning Electron Microscope Phenom ProX

Directory of Open Access Journals (Sweden)

Vertsanova, O.V.

2014-03-01

Full Text Available Phenom ProX — morden effective universal desktop Scanning Electron Microscope with integrated EDS system. Phenom-World helps customers to stay competitive in a world where critical dimensions are continuously getting smaller. All Phenom desktop systems give direct access to the high resolution and high-quality imaging and analysis required in a large variety of applications. They are affordable, flexible and a fast tool enabling engineers, technicians, researchers and educational professionals to investigate micron and submicron structures.

Electron Bio-Imaging Centre (eBIC): the UK national research facility for biological electron microscopy.

Science.gov (United States)

Clare, Daniel K; Siebert, C Alistair; Hecksel, Corey; Hagen, Christoph; Mordhorst, Valerie; Grange, Michael; Ashton, Alun W; Walsh, Martin A; Grünewald, Kay; Saibil, Helen R; Stuart, David I; Zhang, Peijun

2017-06-01

The recent resolution revolution in cryo-EM has led to a massive increase in demand for both time on high-end cryo-electron microscopes and access to cryo-electron microscopy expertise. In anticipation of this demand, eBIC was set up at Diamond Light Source in collaboration with Birkbeck College London and the University of Oxford, and funded by the Wellcome Trust, the UK Medical Research Council (MRC) and the Biotechnology and Biological Sciences Research Council (BBSRC) to provide access to high-end equipment through peer review. eBIC is currently in its start-up phase and began by offering time on a single FEI Titan Krios microscope equipped with the latest generation of direct electron detectors from two manufacturers. Here, the current status and modes of access for potential users of eBIC are outlined. In the first year of operation, 222 d of microscope time were delivered to external research groups, with 95 visits in total, of which 53 were from unique groups. The data collected have generated multiple high- to intermediate-resolution structures (2.8-8 Å), ten of which have been published. A second Krios microscope is now in operation, with two more due to come online in 2017. In the next phase of growth of eBIC, in addition to more microscope time, new data-collection strategies and sample-preparation techniques will be made available to external user groups. Finally, all raw data are archived, and a metadata catalogue and automated pipelines for data analysis are being developed.

An electron-microscopical analysis of capture and initial stages of penetration of nematodes by Arthrobotrys oligospora

NARCIS (Netherlands)

Veenhuis, Marten; Nordbring-Hertz, Birgit; Harder, Wim

1985-01-01

A detailed analysis was made of the capture and subsequent penetration of nematodes by the nematophagous fungus Arthrobotrys oligospora using different electron-microscopical techniques. Capture of nematodes by this fungus occurred on complex hyphal structures (traps) and was effectuated by an

Miniaturized Environmental Scanning Electron Microscope for In Situ Planetary Studies

Science.gov (United States)

Gaskin, Jessica; Abbott, Terry; Medley, Stephanie; Gregory, Don; Thaisen, Kevin; Taylor , Lawrence; Ramsey, Brian; Jerman, Gregory; Sampson, Allen; Harvey, Ralph

2010-01-01

The exploration of remote planetary surfaces calls for the advancement of low power, highly-miniaturized instrumentation. Instruments of this nature that are capable of multiple types of analyses will prove to be particularly useful as we prepare for human return to the moon, and as we continue to explore increasingly remote locations in our Solar System. To this end, our group has been developing a miniaturized Environmental-Scanning Electron Microscope (mESEM) capable of remote investigations of mineralogical samples through in-situ topographical and chemical analysis on a fine scale. The functioning of an SEM is well known: an electron beam is focused to nanometer-scale onto a given sample where resulting emissions such as backscattered and secondary electrons, X-rays, and visible light are registered. Raster scanning the primary electron beam across the sample then gives a fine-scale image of the surface topography (texture), crystalline structure and orientation, with accompanying elemental composition. The flexibility in the types of measurements the mESEM is capable of, makes it ideally suited for a variety of applications. The mESEM is appropriate for use on multiple planetary surfaces, and for a variety of mission goals (from science to non-destructive analysis to ISRU). We will identify potential applications and range of potential uses related to planetary exploration. Over the past few of years we have initiated fabrication and testing of a proof-of-concept assembly, consisting of a cold-field-emission electron gun and custom high-voltage power supply, electrostatic electron-beam focusing column, and scanning-imaging electronics plus backscatter detector. Current project status will be discussed. This effort is funded through the NASA Research Opportunities in Space and Earth Sciences - Planetary Instrument Definition and Development Program.

Phase detection electronics for CLIC

CERN Document Server

Andersson, A

2011-01-01

The Compact Linear Collider (CLIC) requires very tight RF phase synchronisation in order to preserve high luminosity. The electronics required for processing the signals delivered from the phase pick-ups present a significant challenge. This paper discusses the strategy adopted to achieve a sufficiently accurate measurement of the phase. Performance measurements performed in the lab of some of the sub-systems are also presented.

Phase boundary in compatible and incompatible polymer blends studied by micro indentation test and microscopic observations

International Nuclear Information System (INIS)

Mina, M. F.; Akhtar, F.; Haque, M.E.

2003-10-01

The phase boundary of incompatible polymer blends such as poly (methyl methacrylate) (PMMA)/natural rubber (NR) and polyestyrene (PS)/NR as well as compatible blends such as PMMA/NR/epoxidizer NR (compatibilizer) and PS/NR/styrene-butadiene-styrene (SBS) block copolymer (compatibilizer) was studied by means of microhardness (H) technique and microscopy. Solution grown films of neat PMMA, PS and blended films of PMMA/NR, PS/NR, PMMA/NR/ENR and PS/NR/SBS were cast using a common solvent (toluene). While the neat PMMA and PS provide constant hardness values of 178 and 173 MPa, respectively, the binary (incompatible) and the ternary (compatible) blends show a conspicuous H-decrease (PMMA/NR=140 MPa, PS/NR=167 MPa, PMMA/NR/ENR=109 MPa and PS/NR/SBS=127 MPa). Scanning electron microscopy and optical microscopy reveal clear difference of the phase boundary of compatible (smooth boundary) and incompatible (sharp boundary) blends. Besides, the compatibilizer blends are characterised by the thinnest phase boundary (30 μm), which is found about 60 μm in the incompatible blends, showing a final hardness value that demonstrates the compatibilizer to be smoothly distributed in the interface between the two blend components. Results highlight that microindentation technique, in combination with microscopic observations, is a sensitive tool for studying the breadth and quality of the interphase boundary in non- or compatibilized polymer blends and other inhomogeneous materials. (author)

Characterization of polycapillary optics installed in an analytical electron microscope

International Nuclear Information System (INIS)

Takano, Akira; Maehata, Keisuke; Iyomoto, Naoko; Hara, Toru; Mitsuda, Kazuhisa; Yamasaki, Noriko; Tanaka, Keiichi

2016-01-01

An energy-dispersive spectrometer with a superconducting transition edge sensor (TES) microcalorimeter mounted on a scanning transmission electron microscope (STEM) is developed to enhance the accuracy of nanoscale materials analysis. TES microcalorimeters generally have sensitive surface areas of the order of 100 × 100 µm 2 . Also, the magnetic field generated by the STEM objective lens means that a TES microcalorimeter cannot be placed in a STEM column. We therefore use polycapillary optics to collect the X-rays. In this study, X-rays are collected from a STEM specimen and are then focused on a silicon drift detector; from these measurements, the optics are characterized and the experimental results are compared with the design of the optics. (author)

On the optical stability of high-resolution transmission electron microscopes

International Nuclear Information System (INIS)

Barthel, J.; Thust, A.

2013-01-01

In the recent two decades the technique of high-resolution transmission electron microscopy experienced an unprecedented progress through the introduction of hardware aberration correctors and by the improvement of the achievable resolution to the sub-Ångström level. The important aspect that aberration correction at a given resolution requires also a well defined amount of optical stability has received little attention so far. Therefore we investigate the qualification of a variety of high-resolution electron microscopes to maintain an aberration corrected optical state in terms of an optical lifetime. We develop a comprehensive statistical framework for the estimation of the optical lifetime and find remarkably low values between tens of seconds and a couple of minutes. Probability curves are introduced, which inform the operator about the chance to work still in the fully aberration corrected state. - Highlights: • We investigate the temporal stability of optical aberrations in HRTEM. • We develop a statistical framework for the estimation of optical lifetimes. • We introduce plots showing the success probability for aberration-free work. • Optical lifetimes in sub-Ångström electron microscopy are surprisingly low. • The success of aberration correction depends strongly on the optical stability

Manipulation of nanoparticles of different shapes inside a scanning electron microscope

Directory of Open Access Journals (Sweden)

Boris Polyakov

2014-02-01

Full Text Available In this work polyhedron-like gold and sphere-like silver nanoparticles (NPs were manipulated on an oxidized Si substrate to study the dependence of the static friction and the contact area on the particle geometry. Measurements were performed inside a scanning electron microscope (SEM that was equipped with a high-precision XYZ-nanomanipulator. To register the occurring forces a quartz tuning fork (QTF with a glued sharp probe was used. Contact areas and static friction forces were calculated by using different models and compared with the experimentally measured force. The effect of NP morphology on the nanoscale friction is discussed.

Scanning-electron-microscope study of normal-impingement erosion of ductile metals

Science.gov (United States)

Brainard, W. A.; Salik, J.

1980-01-01

Scanning electron microscopy was used to characterize the erosion of annealed copper and aluminum surfaces produced by both single- and multiple-particle impacts. Macroscopic 3.2 mm diameter steel balls and microscopic, brittle erodant particles were projected by a gas gun system so as to impact at normal incidence at speeds up to 140 m/sec. During the impacts by the brittle erodant particles, at lower speeds the erosion behavior was similar to that observed for the larger steel balls. At higher velocities, particle fragmentation and the subsequent cutting by the radial wash of debris created a marked change in the erosion mechanism.

In situ hybridization at the electron microscope level: hybrid detection by autoradiography and colloidal gold.

Science.gov (United States)

Hutchison, N J; Langer-Safer, P R; Ward, D C; Hamkalo, B A

1982-11-01

In situ hybridization has become a standard method for localizing DNA or RNA sequences in cytological preparations. We developed two methods to extend this technique to the transmission electron microscope level using mouse satellite DNA hybridization to whole mount metaphase chromosomes as the test system. The first method devised is a direct extension of standard light microscope level using mouse satellite DNA hybridization to whole mount metaphase chromosomes as the test system. The first method devised is a direct extension of standard light microscope in situ hybridization. Radioactively labeled complementary RNA (cRNA) is hybridized to metaphase chromosomes deposited on electron microscope grids and fixed in 70 percent ethanol vapor; hybridixation site are detected by autoradiography. Specific and intense labeling of chromosomal centromeric regions is observed even after relatively short exposure times. Inerphase nuclei present in some of the metaphase chromosome preparations also show defined paatterms of satellite DNA labeling which suggests that satellite-containing regions are associate with each other during interphase. The sensitivity of this method is estimated to at least as good as that at the light microscope level while the resolution is improved at least threefold. The second method, which circumvents the use of autoradiogrphic detection, uses biotin-labeled polynucleotide probes. After hybridization of these probes, either DNA or RNA, to fixed chromosomes on grids, hybrids are detected via reaction is improved at least threefold. The second method, which circumvents the use of autoradiographic detection, uses biotin-labeled polynucleotide probes. After hybridization of these probes, either DNA or RNA, to fixed chromosomes on grids, hybrids are detected via reaction with an antibody against biotin and secondary antibody adsorbed to the surface of over centromeric heterochromatin and along the associated peripheral fibers. Labeling is on average

Dark-field electron holography for the measurement of geometric phase

International Nuclear Information System (INIS)

Hytch, M.J.; Houdellier, F.; Huee, F.; Snoeck, E.

2011-01-01

The genesis, theoretical basis and practical application of the new electron holographic dark-field technique for mapping strain in nanostructures are presented. The development places geometric phase within a unified theoretical framework for phase measurements by electron holography. The total phase of the transmitted and diffracted beams is described as a sum of four contributions: crystalline, electrostatic, magnetic and geometric. Each contribution is outlined briefly and leads to the proposal to measure geometric phase by dark-field electron holography (DFEH). The experimental conditions, phase reconstruction and analysis are detailed for off-axis electron holography using examples from the field of semiconductors. A method for correcting for thickness variations will be proposed and demonstrated using the phase from the corresponding bright-field electron hologram. -- Highlights: → Unified description of phase measurements in electron holography. → Detailed description of dark-field electron holography for geometric phase measurements. → Correction procedure for systematic errors due to thickness variations.

Electron microscope studies

International Nuclear Information System (INIS)

Crewe, A.V.; Kapp, O.H.

1990-01-01

Our laboratory has made significant progress this year in devising improved electron-optical systems, in studying invertebrate hemoglobins with the STEM, and in achieving a workable sub-angstrom STEM. Our goal in electron optics is to improve resolution by producing spherical and chromatic aberration coefficients with signs opposite those of magnetic lenses. We have progressed toward this goal through calculations that explore the addition of electrodes to electron mirrors to reduce these two geometric aberrations and by devising a beam separation system that won't introduce asymmetrical aberrations. Some promising new designs of magnetic lenses for SEM applications have also been investigated. We have continued our exploration of the quaternary structure of the invertebrate hemoglobins and are now among the top laboratories in this area of expertise. In addition, we have overcome many of our electronic difficulties on the sub-angstrom STEM and have made significant progress toward achieving an operational system. The addition of an IBM RISC-6000 workstation to our lab has significantly increased our image processing capabilities

In situ investigation of bismuth nanoparticles formation by transmission electron microscope.

Science.gov (United States)

Liu, Liming; Wang, Honghang; Yi, Zichuan; Deng, Quanrong; Lin, Zhidong; Zhang, Xiaowen

2018-02-01

Bismuth (Bi) nanoparticles are prepared by using NaBi(MoO 4 ) 2 nanosheets in the beam of electrons emitted by transmission electron microscope. The formation and growth of Bi nanoparticles are investigated in situ. The sizes of Bi nanoparticles are confined within the range of 6-10nm by controlling irradiation time. It is also observed that once the diameter of nanoparticles is larger than 10nm, the Bi particles are stable as a result of the immobility of large nanoparticles. In addition, some nanoparticles on the edges form nanorods, which are explained as the result of a coalescence process, if the irradiation period is longer than 10min. The in situ research on Bi nanoparticles facilitates in-depth investigations of the physicochemical behavior and provides more potential applications in various fields such as sensors, catalysts and optical devices. Copyright © 2017 Elsevier Ltd. All rights reserved.

Dynamic investigation of electron trapping and charge decay in electron-irradiated Al sub 2 O sub 3 in a scanning electron microscope: Methodology and mechanisms

CERN Document Server

Fakhfakh, S; Belhaj, M; Fakhfakh, Z; Kallel, A; Rau, E I

2002-01-01

The charging and discharging of polycrystalline Al sub 2 O sub 3 submitted to electron-irradiation in a scanning electron microscope (SEM) are investigated by means of the displacement current method. To circumvent experimental shortcomings inherent to the use of the basic sample holder, a redesign of the latter is proposed and tests are carried out to verify its operation. The effects of the primary beam accelerating voltage on charging, flashover and discharging phenomena during and after electron-irradiation are studied. The experimental results are then analyzed. In particular, the divergence between the experimental data and those predicted by the total electron emission yield approach (TEEYA) is discussed. A partial discharge was observed immediately after the end of the electron-irradiation exposure. The experimental data suggests, that the discharge is due to the evacuation to the ground, along the insulator surface, of released electrons from shallow traps at (or in the close vicinity of) the insulat...

Formation of a Parasitophorous Vacuole in a Nonadequate Experimental Host: Electron Microscopical and X-Ray Microanalytical Study

Czech Academy of Sciences Publication Activity Database

Žižka, Zdeněk

2005-01-01

Roč. 50, č. 1 (2005), 05-12 ISSN 0015-5632 Institutional research plan: CEZ:AV0Z50200510 Keywords : electron microscopical * x-ray Subject RIV: EE - Microbiology, Virology Impact factor: 0.918, year: 2005

Accelerator-based Single-shot Ultrafast Transmission Electron Microscope with Picosecond Temporal Resolution and Nanometer Spatial Resolution

OpenAIRE

Xiang, D.; Fu, F.; Zhang, J.; Huang, X.; Wang, L.; Wang, X.; Wan, W.

2014-01-01

We present feasibility study of an accelerator-based ultrafast transmission electron microscope (u-TEM) capable of producing a full field image in a single-shot with simultaneous picosecond temporal resolution and nanometer spatial resolution. We study key physics related to performance of u-TEMs, and discuss major challenges as well as possible solutions for practical realization of u-TEMs. The feasibility of u-TEMs is confirmed through simulations using realistic electron beam parameters. W...

Quantum Phase Extraction in Isospectral Electronic Nanostructures

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