Assessing strain mapping by electron backscatter diffraction and confocal Raman microscopy using wedge-indented Si

Energy Technology Data Exchange (ETDEWEB)

Friedman, Lawrence H.; Vaudin, Mark D.; Stranick, Stephan J.; Stan, Gheorghe; Gerbig, Yvonne B.; Osborn, William; Cook, Robert F., E-mail: robert.cook@nist.gov

2016-04-15

The accuracy of electron backscatter diffraction (EBSD) and confocal Raman microscopy (CRM) for small-scale strain mapping are assessed using the multi-axial strain field surrounding a wedge indentation in Si as a test vehicle. The strain field is modeled using finite element analysis (FEA) that is adapted to the near-indentation surface profile measured by atomic force microscopy (AFM). The assessment consists of (1) direct experimental comparisons of strain and deformation and (2) comparisons in which the modeled strain field is used as an intermediate step. Direct experimental methods (1) consist of comparisons of surface elevation and gradient measured by AFM and EBSD and of Raman shifts measured and predicted by CRM and EBSD, respectively. Comparisons that utilize the combined FEA–AFM model (2) consist of predictions of distortion, strain, and rotation for comparison with EBSD measurements and predictions of Raman shift for comparison with CRM measurements. For both EBSD and CRM, convolution of measurements in depth-varying strain fields is considered. The interconnected comparisons suggest that EBSD was able to provide an accurate assessment of the wedge indentation deformation field to within the precision of the measurements, approximately 2×10{sup −4} in strain. CRM was similarly precise, but was limited in accuracy to several times this value. - Highlights: • We map strain by electron backscatter diffraction and confocal Raman microscopy. • The test vehicle is the multi-axial strain field of wedge-indented silicon. • Strain accuracy is assessed by direct experimental intercomparison. • Accuracy is also assessed by atomic force microscopy and finite element analyses. • Electron diffraction measurements are accurate; Raman measurements need refinement.

Assessing strain mapping by electron backscatter diffraction and confocal Raman microscopy using wedge-indented Si

International Nuclear Information System (INIS)

Friedman, Lawrence H.; Vaudin, Mark D.; Stranick, Stephan J.; Stan, Gheorghe; Gerbig, Yvonne B.; Osborn, William; Cook, Robert F.

2016-01-01

The accuracy of electron backscatter diffraction (EBSD) and confocal Raman microscopy (CRM) for small-scale strain mapping are assessed using the multi-axial strain field surrounding a wedge indentation in Si as a test vehicle. The strain field is modeled using finite element analysis (FEA) that is adapted to the near-indentation surface profile measured by atomic force microscopy (AFM). The assessment consists of (1) direct experimental comparisons of strain and deformation and (2) comparisons in which the modeled strain field is used as an intermediate step. Direct experimental methods (1) consist of comparisons of surface elevation and gradient measured by AFM and EBSD and of Raman shifts measured and predicted by CRM and EBSD, respectively. Comparisons that utilize the combined FEA–AFM model (2) consist of predictions of distortion, strain, and rotation for comparison with EBSD measurements and predictions of Raman shift for comparison with CRM measurements. For both EBSD and CRM, convolution of measurements in depth-varying strain fields is considered. The interconnected comparisons suggest that EBSD was able to provide an accurate assessment of the wedge indentation deformation field to within the precision of the measurements, approximately 2×10"−"4 in strain. CRM was similarly precise, but was limited in accuracy to several times this value. - Highlights: • We map strain by electron backscatter diffraction and confocal Raman microscopy. • The test vehicle is the multi-axial strain field of wedge-indented silicon. • Strain accuracy is assessed by direct experimental intercomparison. • Accuracy is also assessed by atomic force microscopy and finite element analyses. • Electron diffraction measurements are accurate; Raman measurements need refinement.

Identification of phases in zinc alloy powders using electron backscatter diffraction

Energy Technology Data Exchange (ETDEWEB)

Perez, Martin G. [Graduate Center for Materials Research, University of Missouri-Rolla, Rolla, MO 65409 (United States); Kenik, Edward A. [Oak Ridge National Laboratory, 100 Bethel Valley Rd., Bldg. 4515, MS-6064, P.O. Box 2008, Oak Ridge, TN 37831 (United States); O' Keefe, Matthew J. [Graduate Center for Materials Research, University of Missouri-Rolla, Rolla, MO 65409 (United States)]. E-mail: mjokeefe@umr.edu; Miller, F. Scott [Graduate Center for Materials Research, University of Missouri-Rolla, Rolla, MO 65409 (United States); Johnson, Benedict [Graduate Center for Materials Research, University of Missouri-Rolla, Rolla, MO 65409 (United States)

2006-05-25

Scanning electron microscopy and electron backscatter diffraction (EBSD) were used for the structural characterization of phases in Zn alloy powders. Commercial Zn alloy powders contained additions of <1000 ppm of Bi, In, Al or Mg. Bismuth and In have extremely low solubility in Zn and form intermetallic Bi-In compounds which segregate to the Zn grain boundaries. The Bi-In phases were <0.3 {mu}m in size, had low melting points, and were not abundant enough for EBSD analysis. Increasing the alloying additions 20-40-fold resulted in Bi-In phases >1 {mu}m that could be used for EBSD analysis for phase characterization. Deformation-free microstructures were obtained by mechanical polishing and ion milling. The Zn matrix was characterized as Zn via EBSD. A BiIn{sub 2} phase was identified in the powder microstructures via EBSD. An In phase with 8-9 wt.% Bi was identified using low voltage energy dispersive spectroscopy and closely matched the composition predicted by the Bi-In phase diagram.

High resolution electron backscatter diffraction (EBSD) data from calcite biominerals in recent gastropod shells.

Science.gov (United States)

Pérez-Huerta, Alberto; Dauphin, Yannicke; Cuif, Jean Pierre; Cusack, Maggie

2011-04-01

Electron backscatter diffraction (EBSD) is a microscopy technique that reveals in situ crystallographic information. Currently, it is widely used for the characterization of geological materials and in studies of biomineralization. Here, we analyze high resolution EBSD data from biogenic calcite in two mollusk taxa, Concholepas and Haliotis, previously used in the understanding of complex biomineralization and paleoenvironmental studies. Results indicate that Concholepas has less ordered prisms than in Haliotis, and that in Concholepas the level of order is not homogenous in different areas of the shell. Overall, the usefulness of data integration obtained from diffraction intensity and crystallographic orientation maps, and corresponding pole figures, is discussed as well as its application to similar studies. © 2010 Elsevier Ltd. All rights reserved.

Principles of electron backscattering by solids and thin films

International Nuclear Information System (INIS)

Niedrig, H.

1977-01-01

The parameters concerning the electron backscattering from thin films and solids (atomic scattering cross-section, atomic number, single/multiple scattering, film thickness of self-supporting films and of surface films on bulk substrates, scattering angular distribution, angle of incidence, diffraction effects) are described. Their influence on some important contrast mechanisms in scanning electron microscopy (thickness contrast, Z/material contrast, tilting/topography contrast, orientation contrast) is discussed. The main backscattering electron detection systems are briefly described. (orig.) [de

Accurate measurement of the orientation relationship of lath martensite and bainite by electron backscatter diffraction analysis

International Nuclear Information System (INIS)

Miyamoto, G.; Takayama, N.; Furuhara, T.

2009-01-01

A new method to determine the orientation relationship between martensite and bainite with the parent austenite is developed based on electron backscatter diffraction analysis. This method can determine the orientation relationship accurately without the presence of retained austenite, and is applicable to lath martensite and bainite in low-alloyed carbon steels. The angles between close-packed directions are about 3 o for lath martensite regardless of the carbon content, while the angles between close-packed planes become smaller with increasing carbon content.

Spatially resolved determination of lattice distortions in silicon nanostructures by means of electron-backscattering diffraction

International Nuclear Information System (INIS)

Krause, Michael

2013-01-01

In the submitted thesis, a novel combined approach of both focused ion beam (FIB) based target preparation and strain determination using electron backscatter diffraction (EBSD) in semiconductor nanostructures is presented. In the first part, a powerful cross-correlation algorithm for detecting small feature shifts within EBSD patterns and, consequently, determining the strain, is presented. The corresponding strain sensitivity is demonstrated using dynamically simulated diffraction patterns. Furthermore, novel procedures for automated pattern analysis are introduced. Results of systematic studies concerning the influence of ion species, ion energy and dose density on the surface quality of silicon surfaces are presented in the second part. For that matter, the assessment of surface amorphization and rippling is based on high resolution microstructural diagnostics (TEM, AFM, Raman) and molecular dynamics simulation. The high application potential of combined FIB preparation and strain analysis using EBSD is exemplarily demonstrated for a 60 nm thick sSOI-sample. The good agreement with established techniques like Raman spectroscopy and X-ray diffraction is also shown.

Determination of dislocation density by electron backscatter diffraction and X-ray line profile analysis in ferrous lath martensite

International Nuclear Information System (INIS)

Berecz, Tibor; Jenei, Péter; Csóré, András; Lábár, János; Gubicza, Jenő

2016-01-01

The microstructure and the dislocation density in as-quenched ferrous lath martensite were studied by different methods. The blocks, packets and variants formed due to martensitic transformation were identified and their sizes were determined by electron backscatter diffraction (EBSD). Concomitant transmission electron microscopy (TEM) investigation revealed that the laths contain subgrains with the size between 50 and 100 nm. A novel evaluation procedure of EBSD images was elaborated for the determination of the density and the space distribution of geometrically necessary dislocations from the misorientation distribution. The total dislocation density obtained by X-ray diffraction line profile analysis was in good agreement with the value determined by EBSD, indicating that the majority of dislocations formed due to martensitic transformation during quenching are geometrically necessary dislocations.

Orientation effects on indexing of electron backscatter diffraction patterns

International Nuclear Information System (INIS)

Nowell, Matthew M.; Wright, Stuart I.

2005-01-01

Automated Electron Backscatter Diffraction (EBSD) has become a well-accepted technique for characterizing the crystallographic orientation aspects of polycrystalline microstructures. At the advent of this technique, it was observed that patterns obtained from grains in certain crystallographic orientations were more difficult for the automated indexing algorithms to accurately identify than patterns from other orientations. The origin of this problem is often similarities between the EBSD pattern of the correct orientation and patterns from other orientations or phases. While practical solutions have been found and implemented, the identification of these problem orientations generally occurs only after running an automated scan, as problem orientations are often readily apparent in the resulting orientation maps. However, such an approach only finds those problem orientations that are present in the scan area. It would be advantageous to identify all regions of orientation space that may present problems for automated indexing prior to initiating an automated scan, and to minimize this space through the optimization of acquisition and indexing parameters. This work presents new methods for identifying regions in orientation space where the reliability of the automated indexing is suspect prior to performing a scan. This methodology is used to characterize the impact of various parameters on the indexing algorithm

Electron backscatter diffraction applied to lithium sheets prepared by broad ion beam milling.

Science.gov (United States)

Brodusch, Nicolas; Zaghib, Karim; Gauvin, Raynald

2015-01-01

Due to its very low hardness and atomic number, pure lithium cannot be prepared by conventional methods prior to scanning electron microscopy analysis. Here, we report on the characterization of pure lithium metallic sheets used as base electrodes in the lithium-ion battery technology using electron backscatter diffraction (EBSD) and X-ray microanalysis using energy dispersive spectroscopy (EDS) after the sheet surface was polished by broad argon ion milling (IM). No grinding and polishing were necessary to achieve the sufficiently damage free necessary for surface analysis. Based on EDS results the impurities could be characterized and EBSD revealed the microsctructure and microtexture of this material with accuracy. The beam damage and oxidation/hydration resulting from the intensive use of IM and the transfer of the sample into the microscope chamber was estimated to be effect on the surface temperature. However, a cryo-stage should be used if available during milling to guaranty a heating artefact free surface after the milling process. © 2014 Wiley Periodicals, Inc.

Tackling pseudosymmetry problems in electron backscatter diffraction (EBSD) analyses of perovskite structures

Science.gov (United States)

Mariani, Elisabetta; Kaercher, Pamela; Mecklenburgh, Julian; Wheeler, John

2016-04-01

Perovskite minerals form an important mineral group that has applications in Earth science and emerging alternative energy technologies, however crystallographic quantification of these minerals with electron backscatter diffraction (EBSD) is not accurate due to pseudosymmetry problems. The silicate perovskite Bridgmanite, (Mg,Fe)SiO3, is understood to be the dominant phase in the Earth's lower mantle. Gaining insight into its physical and rheological properties is therefore vital to understand the dynamics of the Earth's deep interior. Rock deformation experiments on analogue perovskite phases, for example (Ca,Sr)TiO3, combined with quantitative microstructural analyses of the recovered samples by EBSD, yield datasets that can reveal what deformation mechanisms may dominate the flow of perovskite in the lower mantle. Additionally, perovskite structures have important technological applications as new, suitable cathodes for the operation of more efficient and environmentally-friendly solid oxide fuel cells (SOFC). In recent years they have also been recognised as a potential substitute for silicon in the next generation of photovoltaic cells for the construction of economic and energy efficient solar panels. EBSD has the potential to be a valuable tool for the study of crystal orientations achieved in perovskite substrates as crystal alignment has a direct control on the properties of these materials. However, perovskite structures currently present us with challenges during the automated indexing of Kikuchi bands in electron backscatter diffraction patterns (EBSPs). Such challenges are represented by the pseudosymmetric character of perovskites, where atoms are subtly displaced (0.005 nm to 0.05 nm) from their higher symmetry positions. In orthorhombic Pbnm perovskites, for example, pseudosymmetry may be evaluated from the c/a unit cell parameter ratio, which is very close to 1. Two main types of distortions from the higher symmetry structure are recognised: a

Reconstruction of Laser-Induced Surface Topography from Electron Backscatter Diffraction Patterns.

Science.gov (United States)

Callahan, Patrick G; Echlin, McLean P; Pollock, Tresa M; De Graef, Marc

2017-08-01

We demonstrate that the surface topography of a sample can be reconstructed from electron backscatter diffraction (EBSD) patterns collected with a commercial EBSD system. This technique combines the location of the maximum background intensity with a correction from Monte Carlo simulations to determine the local surface normals at each point in an EBSD scan. A surface height map is then reconstructed from the local surface normals. In this study, a Ni sample was machined with a femtosecond laser, which causes the formation of a laser-induced periodic surface structure (LIPSS). The topography of the LIPSS was analyzed using atomic force microscopy (AFM) and reconstructions from EBSD patterns collected at 5 and 20 kV. The LIPSS consisted of a combination of low frequency waviness due to curtaining and high frequency ridges. The morphology of the reconstructed low frequency waviness and high frequency ridges matched the AFM data. The reconstruction technique does not require any modification to existing EBSD systems and so can be particularly useful for measuring topography and its evolution during in situ experiments.

On the optimum resolution of transmission-electron backscattered diffraction (t-EBSD)

Energy Technology Data Exchange (ETDEWEB)

Bremen, R. van; Ribas Gomes, D.; Jeer, L.T.H. de; Ocelík, V., E-mail: v.ocelik@rug.nl; De Hosson, J.Th.M.

2016-01-15

The work presented aims at determining the optimum physical resolution of the transmission-electron backscattered diffraction (t-EBSD) technique. The resolution depends critically on intrinsic factors such as the density, atomic number and thickness of the specimen but also on the extrinsic experimental set-up of the electron beam voltage, specimen tilt and detector position. In the present study, the so-called physical resolution of a typical t-EBSD set-up was determined with the use of Monte Carlo simulations and confronted to experimental findings. In the case of a thin Au film of 20 nm, the best resolution obtained was 9 nm whereas for a 100 nm Au film the best resolution was 66 nm. The precise dependence of resolution on thickness was found to vary differently depending on the specific elements involved. This means that the resolution of each specimen should be determined individually. Experimentally the median probe size of the t-EBSD for a 140 nm thick AuAg specimen was measured to be 87 nm. The first and third quartiles of the probe size measurements were found to be 60 nm and 118 nm. Simulation of this specimen resulted in a resolution of 94 nm which fits between these quartiles. - Highlights: • Intrinsic and extrinsic factors affecting resolution of t-EBSD are determined and characterized. • Distinction between resolutions of transmitted and detected electrons is determined. • The simulated results are confirmed experimentally on 140 nm thick AuAg foil.

A preliminary electron backscattered diffraction study of sintered NdFeB-type magnets.

Science.gov (United States)

Lillywhite, S J; Williams, A J; Davies, B E; Harris, I R

2002-03-01

This paper reports, for the first time, the use of electron backscattered diffraction (EBSD) to study orientation in sintered NdFeB type magnets. The magnetic properties of NdFeB magnets are greatly improved if a strong crystallographic texture is firstly achieved, namely, the direction of the c-axis is along the direction of magnetization. A systematic survey of sample preparation techniques showed that samples that were mechanically polished and then etched gave the most reliable EBSD data. Analyses were made using both fully automated EBSD scans and by EBSD measurements taken after manual movement of the beam. The EBSD results are presented as secondary electron SEM micrographs, orientation images and 001 pole figures. For the selection of grains investigated, the deviation of the c-axis was shown to be between 10 degrees and 30 degrees from the ideal [001]//magnetization direction. It is demonstrated that EBSD is a valuable tool for characterizing the microstructure and texture relationships and for assessing the performance of the processing routes of NdFeB magnets.

Initial microstructural study of a Ce-La alloy using electron backscattered diffraction

International Nuclear Information System (INIS)

Scott, Thomas B.; Younes, Charles M.; Ling, Michael; Jones, Christopher P.; Nicholson, John A.; Heard, Peter J.; Jenkins, Roderick

2011-01-01

Research highlights: → First ever successful EBSD microstructural analysis of Ce-La alloy. → Successful preparation using electro-polishing in the open laboratory. → Equiaxed grains 20-40 μm in size dominate the microstructure, with random orientations, relatively straight grain boundary contacts and no evidence for crystal twinning. → All grains matched to a fcc γ-phase. → Problematic presence of entrapped oxide particles. - Abstract: To better understand and exploit the unique electronic and structural properties of f-block metals and their alloys it is perceived that an improved knowledge of the microstructural characteristics and phase changes as a function of temperature and pressure, is necessary. For other different types of metallic systems, the use of electron back-scattered diffraction (EBSD) is becoming a common practice in order to obtain detailed microstructural information, but this has, as yet, been very limited in case of f-block metals. Because of their extreme affinity to oxygen and rapid surface reaction, EBSD studies of this metal-category are very sparse with only one work published on cerium metal providing an example of technical hurdles for a prerequisite oxide-free metal surface. Specifically the need to remove the oxide by ion etching was considered essential to enable a successful EBSD analysis. The current work presents the results of a first attempt to characterise the microstructure of a Ce-La alloy using EBSD. It demonstrates that high quality diffraction patterns and crystal orientation maps can be successfully obtained following a carefully controlled preparation of the alloy surface in the open laboratory by applying a simple and reproducible electro-polishing procedure without a further need for ion etching in vaccuo.

In situ electron backscatter diffraction (EBSD) during the compression of micropillars

International Nuclear Information System (INIS)

Niederberger, C.; Mook, W.M.; Maeder, X.; Michler, J.

2010-01-01

For the first time, in situ electron backscatter diffraction (EBSD) measurements during compression experiments by a modified nanoindenter on micron-sized single crystal pillars are demonstrated here. The experimental setup and the requirements concerning the compression sample are described in detail. EBSD mappings have been acquired before loading, under load and after unloading for consecutive compression cycles on a focused ion beam (FIB) milled GaAs micropillar. In situ EBSD allows for the determination of crystallographic orientation with sub-100 nm spatial resolution. Thereby, it provides highly localized information pertaining to the deformation phenomena such as elastic bending of the micropillar or the formation of deformation twins and plastic orientation gradients due to geometrically necessary dislocations. The most striking features revealed by in situ EBSD are the non-negligible amount of reversible (elastic) bending of the micropillar and the fact that deformation twinning and dislocation glide initiate where the bending is strongest. Due to this high spatial and orientation resolution, in situ EBSD measurements during micromechanical testing are demonstrated to be a promising technique for the investigation of deformation phenomena at the nano- to micro-scale.

Application of Electron Backscattered Diffraction (EBSD) and Atomic Force Microscopy (AFM) to Determine Texture, Mesotexture, and Grain Boundary Energies in Ceramics

International Nuclear Information System (INIS)

Glass, S.J.; Rohrer, G.S.; Saylor, D.M.; Vedula, V.R.

1999-01-01

Crystallographic orientations in alumina (Al 2 0 3 ) and magnesium aluminate spinel (MgAl 2 0 4 ) were obtained using electron backscattered diffraction (EBSD) patterns. The texture and mesotexture (grain boundary mis-orientations) were random and no special boundaries were observed. The relative grain boundary energies were determined by thermal groove geometries using atomic force microscopy (AFM) to identify relationships between the grain boundary energies and mis-orientations

A study of intergranular corrosion of austenitic stainless steel by electrochemical potentiodynamic reactivation, electron back-scattering diffraction and cellular automaton

Energy Technology Data Exchange (ETDEWEB)

Yu Xiaofei [Department of Chemistry, Shandong University, Jinan 250100 (China); Chen Shenhao [Department of Chemistry, Shandong University, Jinan 250100 (China); State Key Laboratory for Corrosion and Protection, Shenyang 110016 (China)], E-mail: shchen@sdu.edu.cn; Liu Ying; Ren Fengfeng [Department of Chemistry, Shandong University, Jinan 250100 (China)

2010-06-15

The impact of solution and sensitization treatments on the intergranular corrosion (IGC) of austenitic stainless steel (316) was studied by electrochemical potentiodynamic reactivation (EPR) test, and the results showed the degree of sensitization (DOS) decreased as solution treatment temperature and time went up, but it increased as sensitization temperature prolonged. Factors that affected IGC were investigated by field emission scanning electron microscope (FE-SEM) and electron back-scattering diffraction (EBSD). Furthermore, the precipitation evolution of Cr-rich carbides and the distribution of chromium concentration were simulated by cellular automaton (CA), clearly showing the effects of solution and sensitization treatments on IGC.

Practical considerations in the calculation of orientation distribution functions from electron back-scattered diffraction patterns

International Nuclear Information System (INIS)

Bowen, A.W.

1994-01-01

Using model data sets for the Brass orientation, the importance of scatter width, angular accuracy and grain size and volume fraction on the sensitivity of the calculated Orientation Distribution Functions have been determined in order to highlight some of the practical considerations needed in the processing of experimental data from individual grain orientation measurements determined by the Electron Back-Scattered Diffraction technique. It is suggested that the most appropriate scatter width can be calculated from the maximum function height versus scatter width curve in order to accommodate variations in texture sharpness. The sensitivity of the ODF to careful sample preparation, mounting and pattern analysis, in order to keep errors in angular accuracy to 1 or less is demonstrated, as is the imperative need to correct for the size of grains, and their volume fractions. (orig.)

Electron backscatter diffraction study of dislocation content of a macrozone in hot-rolled Ti-6Al-4V alloy

International Nuclear Information System (INIS)

Britton, T. Ben; Birosca, Soran; Preuss, Michael; Wilkinson, Angus J.

2010-01-01

We compare the dislocation substructure within macrozone and non-macrozone regions of hot-rolled Ti-6Al-4 V. Hough-based and cross-correlation-based analysis of electron backscatter diffraction (EBSD) patterns are used to establish the grain orientations and intra-granular misorientations, respectively. The set of geometrically necessary dislocations (GNDs) that support measured lattice curvatures and minimize the total GND line energy are calculated. The GND content in the macrozone is approximately twice that in the non-macrozone region, and GNDs are present at densities ∼10 times higher than GNDs.

In situ electron backscatter diffraction investigation of recrystallization in a copper wire.

Science.gov (United States)

Brisset, François; Helbert, Anne-Laure; Baudin, Thierry

2013-08-01

The microstructural evolution of a cold drawn copper wire (reduction area of 38%) during primary recrystallization and grain growth was observed in situ by electron backscatter diffraction. Two thermal treatments were performed, and successive scans were acquired on samples undergoing heating from ambient temperature to a steady state of 200°C or 215°C. During a third in situ annealing, the temperature was continuously increased up to 600°C. Nuclei were observed to grow at the expense of the deformed microstructure. This growth was enhanced by the high stored energy difference between the nuclei and their neighbors (driving energy in recrystallization) and by the presence of high-angle grain boundaries of high mobility. In the early stages of growth, the nuclei twin and the newly created orientations continue to grow to the detriment of the strained copper. At high temperatures, the disappearance of some twins was evidenced by the migration of the incoherent twin boundaries. Thermal grooving of grain boundaries is observed at these high temperatures and affects the high mobile boundaries but tends to preserve the twin boundaries of lower energy. Thus, grooving may contribute to the twin vanishing.

Analysis of recrystallization behavior of hot-deformed austenite reconstructed from electron backscattering diffraction orientation maps of lath martensite

International Nuclear Information System (INIS)

Kubota, Manabu; Ushioda, Kohsaku; Miyamoto, Goro; Furuhara, Tadashi

2016-01-01

The recrystallization behavior of hot-deformed austenite of a 0.55% C steel at 800 °C was investigated by a method of reconstructing the parent austenite orientation map from an electron backscattering diffraction orientation map of lath martensite. Recrystallized austenite grains were clearly distinguished from un-recrystallized austenite grains. Very good correlation was confirmed between the static recrystallization behavior investigated mechanically by double-hit compression tests and the change in austenite microstructure evaluated by the reconstruction method. The recrystallization behavior of hot-deformed 0.55% C steel at 800 °C is directly revealed and it was observed that by addition of 0.1% V the recrystallization was significantly retarded.

Quantitative analysis of localized stresses in irradiated stainless steels using high resolution electron backscatter diffraction and molecular dynamics modeling

International Nuclear Information System (INIS)

Johnson, D.C.; Kuhr, B.; Farkas, D.; Was, G.S.

2016-01-01

Quantitative measurements of stress near dislocation channel–grain boundary (DC–GB) interaction sites were made using high resolution electron backscatter diffraction (HREBSD) and have been compared with molecular dynamics (MD) simulations. Tensile stress normal to the grain boundary was significantly elevated at discontinuous DC–GB intersections with peak magnitudes roughly an order of magnitude greater than at sites where slip transfer occurred. These results constitute the first measurement of stress amplification at DC–GB intersections and provide support to the theory that high normal stress at the grain boundary may be a key driver for the initiation of irradiation assisted stress corrosion cracks.

Electron Backscatter Diffraction Studies on the Formation of Superlattice Metal Hydride Alloys

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Shuli Yan

2017-12-01

Full Text Available Microstructures of a series of La-Mg-Ni-based superlattice metal hydride alloys produced by a novel method of interaction of a LaNi5 alloy and Mg vapor were studied using a combination of X-ray energy dispersive spectroscopy and electron backscatter diffraction. The conversion rate of LaNi5 increased from 86.8% into 98.2%, and the A2B7 phase abundance increased from 42.5 to 45.8 wt % and reduced to 39.2 wt % with the increase in process time from four to 32 h. During the first stage of reaction, Mg formed discrete grains with the same orientation, which was closely related to the orientation of the host LaNi5 alloy. Mg then diffused through the ab-phase of LaNi5 and formed the AB2, AB3, and A2B7 phases. Diffusion of Mg stalled at the grain boundary of the host LaNi5 alloy. Good alignments in the c-axis between the newly formed superlattice phases and LaNi5 were observed. The density of high-angle grain boundary decreased with the increase in process time and was an indication of lattice cracking.

Experimental evidence concerning the significant information depth of electron backscatter diffraction (EBSD)

Energy Technology Data Exchange (ETDEWEB)

Wisniewski, Wolfgang, E-mail: wolfgang.w@uni-jena.de [Otto-Schott-Institut, Jena University, Fraunhoferstr. 6, 07743 Jena (Germany); Saager, Stefan [Fraunhofer Institute for Organic Electronics, Electron Beam and Plasma Technology FEP, Winterbergstraße 28, 01277 Dresden (Germany); Böbenroth, Andrea [Fraunhofer Institute for the Microstructure of Materials and Systems IMWS, Walter-Huelse-Straße 1, 06120 Halle (Saale) (Germany); Rüssel, Christian [Otto-Schott-Institut, Jena University, Fraunhoferstr. 6, 07743 Jena (Germany)

2017-02-15

Experiments concerning the information depth of electron backscatter diffraction (EBSD) are performed on samples featuring an amorphous wedge on a crystalline substrate and a crystalline wedge on an amorphous substrate. The effects of the acceleration voltage and exemplary software settings on the ability to measure through an amorphous layer are presented. Changes in the EBSD-signal could be detected through a ≈142 nm thick layer of amorphous Si while orientation measurements could be performed through a ≈116 nm thick layer when using a voltage of 30 kV. The complexity of the information depth significant to a given EBSD-pattern and the multiple parameters influencing it are discussed. It is suggested that a “core information depth” is significant to high quality patterns while a larger “maximum information depth” becomes relevant when the pattern quality decreases or the sample is inhomogeneous within the information volume, i.e. in the form of partially crystalline materials or crystal layers in the nm scale. - Highlights: • Experimental evidence of the significant information depth of EBSD is presented. • Effects of the voltage and exemplary software settings are discussed. • Dependence of the significant information depth on the pattern quality is proposed. • The information depth may reach up to 142 nm in Si when using a voltage of 30 kV. • The information depth depends on the available technology.

Electron backscatter diffraction studies of focused ion beam induced phase transformation in cobalt

Energy Technology Data Exchange (ETDEWEB)

Jones, H.G., E-mail: helen.jones@npl.co.uk [National Physical Laboratory, Hampton Road, Teddington, Middlesex TW11 0LW (United Kingdom); Day, A.P. [Aunt Daisy Scientific Ltd, Claremont House, High St, Lydney GL15 5DX (United Kingdom); Cox, D.C. [National Physical Laboratory, Hampton Road, Teddington, Middlesex TW11 0LW (United Kingdom); Advanced Technology Institute, University of Surrey, Guildford GU2 7XH (United Kingdom)

2016-10-15

A focused ion beam microscope was used to induce cubic to hexagonal phase transformation in a cobalt alloy, of similar composition to that of the binder phase in a hardmetal, in a controlled manner at 0°, 45° and 80° ion incident angles. The cobalt had an average grain size of ~ 20 μm, allowing multiple orientations to be studied, exposed to a range of doses between 6 × 10{sup 7} and 2 × 10{sup 10} ions/μm{sup 2}. Electron backscatter diffraction (EBSD) was used to determine the original and induced phase orientations, and area fractions, before and after the ion beam exposure. On average, less phase transformation was observed at higher incident angles and after lower ion doses. However there was an orientation effect where grains with an orientation close to (111) planes were most susceptible to phase transformation, and (101) the least, where grains partially and fully transformed at varying ion doses. - Highlights: •Ion-induced phase change in FCC cobalt was observed at multiple incidence angles. •EBSD was used to study the relationship between grain orientation and transformation. •Custom software analysed ion dose and phase change with respect to grain orientation. •A predictive capability of ion-induced phase change in cobalt was enabled.

Deformation micro-mechanism for compression of magnesium alloys at room temperature analyzed by electron backscatter diffraction

International Nuclear Information System (INIS)

Song, G.S.; Chen, Q.Q.; Zhang, S.H.; Xu, Y.

2015-01-01

Highlights: • In-situ tracking on the evolution of grains orientation of magnesium alloy was carried out by EBSD. • Distributions of twin bands were closely related to the activation of extension twin variants. • Activation of extension twin significantly changes the order of Schmid factor of slips. • Pyramidal slips become the dominant deformation mode at the late stage of compression. - Abstract: In-situ tracking on the evolution of grains orientation of rolled magnesium alloy sheets compressed uniaxially at room temperature was carried out by the method of electron backscatter diffraction (EBSD), and meanwhile, distributions of twin bands, activations of twin and slips were also analyzed. The results show that the distributions of twin bands were closely related to the activation of extension twin variants. The activation of extension twin significantly changes the order of Schmid factor of different slips, and accordingly affects the activation of slips during the subsequent deformation

A correlative approach to segmenting phases and ferrite morphologies in transformation-induced plasticity steel using electron back-scattering diffraction and energy dispersive X-ray spectroscopy.

Science.gov (United States)

Gazder, Azdiar A; Al-Harbi, Fayez; Spanke, Hendrik Th; Mitchell, David R G; Pereloma, Elena V

2014-12-01

Using a combination of electron back-scattering diffraction and energy dispersive X-ray spectroscopy data, a segmentation procedure was developed to comprehensively distinguish austenite, martensite, polygonal ferrite, ferrite in granular bainite and bainitic ferrite laths in a thermo-mechanically processed low-Si, high-Al transformation-induced plasticity steel. The efficacy of the ferrite morphologies segmentation procedure was verified by transmission electron microscopy. The variation in carbon content between the ferrite in granular bainite and bainitic ferrite laths was explained on the basis of carbon partitioning during their growth. Copyright © 2014 Elsevier B.V. All rights reserved.

Analysis of soft magnetic materials by electron backscatter diffraction as a powerful tool

Directory of Open Access Journals (Sweden)

David Schuller

2018-04-01

Full Text Available The current work demonstrates that electron backscatter diffraction (EBSD is a powerful and versatile characterization technique for investigating soft magnetic materials. The properties of soft magnets, e.g., magnetic losses strongly depend on the materials chemical composition and microstructure, including grain size and shape, texture, degree of plastic deformation and elastic strain. In electrical sheet stacks for e-motor applications, the quality of the machined edges/surfaces of each individual sheet is of special interest. Using EBSD, the influence of the punching process on the microstructure at the cutting edge is quantitatively assessed by evaluating the crystallographic misorientation distribution of the deformed grains. Using an industrial punching process, the maximum affected deformation depth is determined to be 200 - 300 μm. In the case of laser cutting, the affected deformation depth is determined to be approximately zero. Reliability and detection limits of the developed EBSD approach are evaluated on non-affected sample regions and model samples containing different indentation test bodies. A second application case is the investigation of the recrystallization process during the annealing step of soft magnetic composites (SMC toroids produced by powder metallurgy as a function of compaction pressure, annealing parameters and powder particle size. With increasing pressure and temperature, the recrystallized area fraction (e.g., grains with crystallographic misorientations 3°.

Energy-weighted dynamical scattering simulations of electron diffraction modalities in the scanning electron microscope.

Science.gov (United States)

Pascal, Elena; Singh, Saransh; Callahan, Patrick G; Hourahine, Ben; Trager-Cowan, Carol; Graef, Marc De

2018-04-01

Transmission Kikuchi diffraction (TKD) has been gaining momentum as a high resolution alternative to electron back-scattered diffraction (EBSD), adding to the existing electron diffraction modalities in the scanning electron microscope (SEM). The image simulation of any of these measurement techniques requires an energy dependent diffraction model for which, in turn, knowledge of electron energies and diffraction distances distributions is required. We identify the sample-detector geometry and the effect of inelastic events on the diffracting electron beam as the important factors to be considered when predicting these distributions. However, tractable models taking into account inelastic scattering explicitly are lacking. In this study, we expand the Monte Carlo (MC) energy-weighting dynamical simulations models used for EBSD [1] and ECP [2] to the TKD case. We show that the foil thickness in TKD can be used as a means of energy filtering and compare band sharpness in the different modalities. The current model is shown to correctly predict TKD patterns and, through the dictionary indexing approach, to produce higher quality indexed TKD maps than conventional Hough transform approach, especially close to grain boundaries. Copyright © 2018 The Authors. Published by Elsevier B.V. All rights reserved.

Plastic strain characterization in austenitic stainless steels and nickel alloys by electron backscatter diffraction

Energy Technology Data Exchange (ETDEWEB)

Saez-Maderuelo, A., E-mail: alberto.saez@ciemat.es [CIEMAT, Av. Complutense, 22-28040 Madrid (Spain); Castro, L.; Diego, G. de [CIEMAT, Av. Complutense, 22-28040 Madrid (Spain)

2011-09-01

Stress corrosion cracking (SCC) is enhanced by cold work and causes many problems in components of the nuclear power plants. Besides, during manufacturing, installation, welding and service of the material, residual strains can be produced increasing the susceptibility to SCC. For this reason, it is important to characterize the degree of plastic strain due to dislocation accumulation in each crystal. Electron backscatter diffraction (EBSD), in conjunction with scanning electron microscope (SEM), has been a great advance in this field because it enables to estimate the plastic strain in a quick and easy way. Nevertheless, over the last few years, a lot of different mathematical expressions to estimate the plastic strain have appeared in the literature. This situation hinders the election of one of them by a novel scientist in this field. Therefore, in this paper some of the more common expressions used in the calculation of the angular misorientation have been presented and discussed in order to clarify their more important aspects. Then, using one of these expressions (average local misorientation), curves relating misorientation density with known levels of strain will be obtained for an austenitic stainless steel 304L and nickel base alloy 690, which have shown a linear behaviour that is in good agreement with results found in the literature. Finally, using curves obtained in previous steps, levels of plastic strain in a plate of nickel base alloy 600 welded with weld metal 182 were estimated between 8 and 10% for a high temperature mill annealing sample.

Plastic strain characterization in austenitic stainless steels and nickel alloys by electron backscatter diffraction

International Nuclear Information System (INIS)

Saez-Maderuelo, A.; Castro, L.; Diego, G. de

2011-01-01

Stress corrosion cracking (SCC) is enhanced by cold work and causes many problems in components of the nuclear power plants. Besides, during manufacturing, installation, welding and service of the material, residual strains can be produced increasing the susceptibility to SCC. For this reason, it is important to characterize the degree of plastic strain due to dislocation accumulation in each crystal. Electron backscatter diffraction (EBSD), in conjunction with scanning electron microscope (SEM), has been a great advance in this field because it enables to estimate the plastic strain in a quick and easy way. Nevertheless, over the last few years, a lot of different mathematical expressions to estimate the plastic strain have appeared in the literature. This situation hinders the election of one of them by a novel scientist in this field. Therefore, in this paper some of the more common expressions used in the calculation of the angular misorientation have been presented and discussed in order to clarify their more important aspects. Then, using one of these expressions (average local misorientation), curves relating misorientation density with known levels of strain will be obtained for an austenitic stainless steel 304L and nickel base alloy 690, which have shown a linear behaviour that is in good agreement with results found in the literature. Finally, using curves obtained in previous steps, levels of plastic strain in a plate of nickel base alloy 600 welded with weld metal 182 were estimated between 8 and 10% for a high temperature mill annealing sample.

Electron backscattering for process control in electron beam welding

International Nuclear Information System (INIS)

Ardenne, T. von; Panzer, S.

1983-01-01

A number of solutions to the automation of electron beam welding is presented. On the basis of electron backscattering a complex system of process control has been developed. It allows an enlarged imaging of the material's surface, improved adjustment of the beam focusing and definite focus positioning. Furthermore, both manual and automated positioning of the electron beam before and during the welding process has become possible. Monitoring of the welding process for meeting standard welding requirements can be achieved with the aid of a control quantity derived from the results of electronic evaluation of the high-frequency electron backscattering

Correlation of electron backscatter diffraction and piezoresponse force microscopy for the nanoscale characterization of ferroelectric domains in polycrystalline lead zirconate titanate

Science.gov (United States)

Burnett, T. L.; Weaver, P. M.; Blackburn, J. F.; Stewart, M.; Cain, M. G.

2010-08-01

The functional properties of ferroelectric ceramic bulk or thin film materials are strongly influenced by their nanostructure, crystallographic orientation, and structural geometry. In this paper, we show how, by combining textural analysis, through electron backscattered diffraction, with piezoresponse force microscopy, quantitative measurements of the piezoelectric properties can be made at a scale of 25 nm, smaller than the domain size. The combined technique is used to obtain data on the domain-resolved effective single crystal piezoelectric response of individual crystallites in Pb(Zr0.4Ti0.6)O3 ceramics. The results offer insight into the science of domain engineering and provide a tool for the future development of new nanostructured ferroelectric materials for memory, nanoactuators, and sensors based on magnetoelectric multiferroics.

Assessment of surface hardening effects from shot peening on a Ni-based alloy using electron backscatter diffraction techniques

International Nuclear Information System (INIS)

Child, D.J.; West, G.D.; Thomson, R.C.

2011-01-01

An electron backscatter diffraction (EBSD)-based tool is described to assess the depth of strain-hardening effects of shot-peening treatments applied to the Ni-based superalloy, Udimet (copy right) alloy 720Li. The method consists of a statistical analysis of a number of data points from each grain scanned based on the grain orientation spread and their relative position from the shot-peened edge. The output is a quantitative measure of the depth of strain-hardening effects. The tool is used at various shot-peening intensities to demonstrate the ability to distinguish between these changes, using a range of intensities from 4 to 10 Almen. An increase in shot-peening intensity is observed to increase the depth of strain-hardening effects in the alloy. A comparison with residual stress measurements using X-ray diffraction for the same material shows that the strain-hardened depth determined by EBSD extends to approximately half the distance of the residual stress present due to shot peening. A comparison is also made with predicted profiles from the Peenstress SM model and subsequent microhardness testing. A positive correlation is observed between strained hardened depth and surface roughness of the peened samples. In each case, the increases in surface roughness and strain-hardened depth diminish toward the upper end of the shot-peening intensity range studied for this alloy.

Geometrically necessary dislocation densities in olivine obtained using high-angular resolution electron backscatter diffraction

Energy Technology Data Exchange (ETDEWEB)

Wallis, David, E-mail: davidwa@earth.ox.ac.uk [Department of Earth Sciences, University of Oxford, South Parks Road, Oxford, Oxfordshire, OX1 3AN (United Kingdom); Hansen, Lars N. [Department of Earth Sciences, University of Oxford, South Parks Road, Oxford, Oxfordshire, OX1 3AN (United Kingdom); Ben Britton, T. [Department of Materials, Imperial College London, Royal School of Mines, Exhibition Road, London SW7 2AZ (United Kingdom); Wilkinson, Angus J. [Department of Materials, University of Oxford, Parks Road, Oxford, Oxfordshire, OX1 3PH (United Kingdom)

2016-09-15

Dislocations in geological minerals are fundamental to the creep processes that control large-scale geodynamic phenomena. However, techniques to quantify their densities, distributions, and types over critical subgrain to polycrystal length scales are limited. The recent advent of high-angular resolution electron backscatter diffraction (HR-EBSD), based on diffraction pattern cross-correlation, offers a powerful new approach that has been utilised to analyse dislocation densities in the materials sciences. In particular, HR-EBSD yields significantly better angular resolution (<0.01°) than conventional EBSD (~0.5°), allowing very low dislocation densities to be analysed. We develop the application of HR-EBSD to olivine, the dominant mineral in Earth's upper mantle by testing (1) different inversion methods for estimating geometrically necessary dislocation (GND) densities, (2) the sensitivity of the method under a range of data acquisition settings, and (3) the ability of the technique to resolve a variety of olivine dislocation structures. The relatively low crystal symmetry (orthorhombic) and few slip systems in olivine result in well constrained GND density estimates. The GND density noise floor is inversely proportional to map step size, such that datasets can be optimised for analysing either short wavelength, high density structures (e.g. subgrain boundaries) or long wavelength, low amplitude orientation gradients. Comparison to conventional images of decorated dislocations demonstrates that HR-EBSD can characterise the dislocation distribution and reveal additional structure not captured by the decoration technique. HR-EBSD therefore provides a highly effective method for analysing dislocations in olivine and determining their role in accommodating macroscopic deformation. - Highlights: • Lattice orientation gradients in olivine were measured using HR-EBSD. • The limited number of olivine slip systems enable simple least squares inversion for GND

Transport equation theory of electron backscattering and x-ray production

International Nuclear Information System (INIS)

Fathers, D.J.; Rez, P.

1978-02-01

A transport equation theory of electron backscattering and x ray production is derived and applied to energy dissipation of 30-KeV electrons for copper as a function of depth and to the energy distribution of backscattered electrons for copper, aluminum, and gold. These results are plotted and compared with experiment. Plots for variations of backscattering with atomic number and with angle of incidence, and polar plots of backscattering for 30-keV electrons at normal incidence are also presented. 10 references, seven figures

The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements

Energy Technology Data Exchange (ETDEWEB)

Tong, Vivian, E-mail: v.tong13@imperial.ac.uk [Department of Materials, Imperial College London, Prince Consort Road, London SW7 2AZ (United Kingdom); Jiang, Jun [Department of Materials, Imperial College London, Prince Consort Road, London SW7 2AZ (United Kingdom); Wilkinson, Angus J. [Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH (United Kingdom); Britton, T. Ben [Department of Materials, Imperial College London, Prince Consort Road, London SW7 2AZ (United Kingdom)

2015-08-15

High resolution, cross-correlation-based, electron backscatter diffraction (EBSD) measures the variation of elastic strains and lattice rotations from a reference state. Regions near grain boundaries are often of interest but overlap of patterns from the two grains could reduce accuracy of the cross-correlation analysis. To explore this concern, patterns from the interior of two grains have been mixed to simulate the interaction volume crossing a grain boundary so that the effect on the accuracy of the cross correlation results can be tested. It was found that the accuracy of HR-EBSD strain measurements performed in a FEG-SEM on zirconium remains good until the incident beam is less than 18 nm from a grain boundary. A simulated microstructure was used to measure how often pattern overlap occurs at any given EBSD step size, and a simple relation was found linking the probability of overlap with step size. - Highlights: • Pattern overlap occurs at grain boundaries and reduces HR-EBSD accuracy. • A test is devised to measure the accuracy of HR-EBSD in the presence of overlap. • High pass filters can sometimes, but not generally, improve HR-EBSD measurements. • Accuracy of HR-EBSD remains high until the reference pattern intensity is <72%. • 9% of points near a grain boundary will have significant error for 200nm step size in Zircaloy-4.

Analysis of soft magnetic materials by electron backscatter diffraction as a powerful tool

Science.gov (United States)

Schuller, David; Hohs, Dominic; Loeffler, Ralf; Bernthaler, Timo; Goll, Dagmar; Schneider, Gerhard

2018-04-01

The current work demonstrates that electron backscatter diffraction (EBSD) is a powerful and versatile characterization technique for investigating soft magnetic materials. The properties of soft magnets, e.g., magnetic losses strongly depend on the materials chemical composition and microstructure, including grain size and shape, texture, degree of plastic deformation and elastic strain. In electrical sheet stacks for e-motor applications, the quality of the machined edges/surfaces of each individual sheet is of special interest. Using EBSD, the influence of the punching process on the microstructure at the cutting edge is quantitatively assessed by evaluating the crystallographic misorientation distribution of the deformed grains. Using an industrial punching process, the maximum affected deformation depth is determined to be 200 - 300 μm. In the case of laser cutting, the affected deformation depth is determined to be approximately zero. Reliability and detection limits of the developed EBSD approach are evaluated on non-affected sample regions and model samples containing different indentation test bodies. A second application case is the investigation of the recrystallization process during the annealing step of soft magnetic composites (SMC) toroids produced by powder metallurgy as a function of compaction pressure, annealing parameters and powder particle size. With increasing pressure and temperature, the recrystallized area fraction (e.g., grains with crystallographic misorientations particle boundaries or areas with existing plastic deformation. The progress of recrystallization is visualized as a function of time and of different particle to grain size distributions. Here, large particles with coarse internal grain structures show a favorable recrystallization behavior which results in large bulk permeability of up to 600 - 700 and lower amount of residual misorientations (>3°).

An electron back-scattered diffraction study on the microstructure evolution of AZ31 Mg alloy during equal channel angular extrusion

International Nuclear Information System (INIS)

Jin Li; Lin Dongliang; Mao Dali; Zeng Xiaoqin; Ding Wenjiang

2006-01-01

Microstructure evolution of AZ31 Mg alloy during equal channel angular extrusion (ECAE) was investigated by electron back-scattered diffraction (EBSD). The grains of AZ31 Mg alloy were refined significantly after ECAE 1-8 passes at 498 K and the distributions of grain size tended to be more uniform with pass number increasing. Frequency of sub-boundaries and low angle grain boundaries (LAGBs) increased at initial stage of deformation, and sub-boundaries and LAGBs evolved into high angle grain boundaries (HAGBs) with further deformation, which resulted in the high frequency of HAGBs in the alloy after ECAE 8 passes. Preferred misorientation angle with frequency peak near 30 deg. and 90 deg. were observed. The frequency peaks were weak after ECAE 1 pass but became stronger with the increase of pass numbers. Micro-textures were formed in AZ31 microstructure during ECAE and were stronger with the pass number increasing

Effect of Welding Heat Input on Microstructure and Texture of Inconel 625 Weld Overlay Studied Using the Electron Backscatter Diffraction Method

Science.gov (United States)

Kim, Joon-Suk; Lee, Hae-Woo

2016-12-01

The grain size and the texture of three specimens prepared at different heat inputs were determined using optical microscopy and the electron backscatter diffraction method of scanning electron microscopy. Each specimen was equally divided into fusion line zone (FLZ), columnar dendrite zone (CDZ), and surface zone (SZ), according to the location of the weld. Fine dendrites were observed in the FLZ, coarse dendrites in the CDZ, and dendrites grew perpendicular to the FLZ and CDZ. As the heat input increased, the melted zone in the vicinity of the FLZ widened due to the higher Fe content. A lower image quality value was observed for the FLZ compared to the other zones. The results of grain size measurement in each zone showed that the grain size of the SZ became larger as the heat input increased. From the inverse pole figure (IPF) map in the normal direction (ND) and the rolling direction (RD), as the heat input increased, a specific orientation was formed. However, a dominant [001] direction was observed in the RD IPF map.

Texture development study during the primary recrystallization of ferritic steels by using X ray and electron backscattering diffraction

International Nuclear Information System (INIS)

Loew, Marjorie

2006-01-01

X ray and electron backscattering diffraction, in distinct levels, were applied to evaluate microstructural changes in two low carbon ferritic steels (2 per cent Si and ABNT 1006), observing the texture development in cold lamination step (skin-pass) and in the subsequent annealing at 760 deg C. In these two steels, results showed that after the skin-pass and annealing in the conditions of the present work, the observed phenomenon is the primary recrystallization. By applying skin-pass dislocations were introduced mostly in low Taylor factor grains as they are prone to be more deformed. Nucleation and grain growth were observed in high density dislocation cell regions. Silicon presence delayed the recovery favoring the sub-boundaries increase. It was not observed the abnormal grain growth, even in the presence of Gross grains. CSL boundaries did not guarantee the grains growth. Growing nuclei gave rise to grains with distinct orientations, showing that the grain growth was not dependent on the previous presence of grains with the developed orientation. This fact demonstrates that the abnormal grain growth is not necessarily related to the Gross grains. (author)

Comparison between magnetic force microscopy and electron back-scatter diffraction for ferrite quantification in type 321 stainless steel

Energy Technology Data Exchange (ETDEWEB)

Warren, A.D., E-mail: Xander.Warren@bristol.ac.uk [Interface Analysis Centre, HH Wills Laboratory, University of Bristol, Bristol BS8 1FD (United Kingdom); Harniman, R.L. [School of Chemistry, University of Bristol, Bristol BS8 1 TS (United Kingdom); Collins, A.M. [School of Chemistry, University of Bristol, Bristol BS8 1 TS (United Kingdom); Bristol Centre for Functional Nanomaterials, Nanoscience and Quantum Information Centre, University of Bristol, Bristol BS8 1FD (United Kingdom); Davis, S.A. [School of Chemistry, University of Bristol, Bristol BS8 1 TS (United Kingdom); Younes, C.M. [Interface Analysis Centre, HH Wills Laboratory, University of Bristol, Bristol BS8 1FD (United Kingdom); Flewitt, P.E.J. [Interface Analysis Centre, HH Wills Laboratory, University of Bristol, Bristol BS8 1FD (United Kingdom); School of Physics, HH Wills Laboratory, University of Bristol, Bristol BS8 1FD (United Kingdom); Scott, T.B. [Interface Analysis Centre, HH Wills Laboratory, University of Bristol, Bristol BS8 1FD (United Kingdom)

2015-01-15

Several analytical techniques that are currently available can be used to determine the spatial distribution and amount of austenite, ferrite and precipitate phases in steels. The application of magnetic force microscopy, in particular, to study the local microstructure of stainless steels is beneficial due to the selectivity of this technique for detection of ferromagnetic phases. In the comparison of Magnetic Force Microscopy and Electron Back-Scatter Diffraction for the morphological mapping and quantification of ferrite, the degree of sub-surface measurement has been found to be critical. Through the use of surface shielding, it has been possible to show that Magnetic Force Microscopy has a measurement depth of 105–140 nm. A comparison of the two techniques together with the depth of measurement capabilities are discussed. - Highlights: • MFM used to map distribution and quantify ferrite in type 321 stainless steels. • MFM results compared with EBSD for same region, showing good spatial correlation. • MFM gives higher area fraction of ferrite than EBSD due to sub-surface measurement. • From controlled experiments MFM depth sensitivity measured from 105 to 140 nm. • A correction factor to calculate area fraction from MFM data is estimated.

Microstructural characterization by electron backscatter diffraction of a hot worked Al-Cu-Mg alloy

Energy Technology Data Exchange (ETDEWEB)

Cepeda-Jimenez, C.M., E-mail: cm.cepeda@cenim.csic.es [Department of Physical Metallurgy, CENIM, CSIC, Av. Gregorio del Amo 8, 28040 Madrid (Spain); Hidalgo, P.; Carsi, M.; Ruano, O.A.; Carreno, F. [Department of Physical Metallurgy, CENIM, CSIC, Av. Gregorio del Amo 8, 28040 Madrid (Spain)

2011-03-25

Research highlights: {yields} The most favourable conditions for hot workability have been determined. {yields} EBSD was employed to characterize the obtained microtexture and microstructure. {yields} The Al 2024 alloy torsion tested at 408 deg. C and 2.1 s{sup -1} showed maximum ductility. {yields} Solid solution and fine precipitates favour a fine microstructure at 408 deg. C. {yields} The increase in test temperature to 467 deg. C produces a sharp decrease in ductility. - Abstract: Hot torsion tests to fracture to simulate thermomechanical processing were carried out on a solution-treated Al-Cu-Mg alloy (Al 2024-T351) at constant temperature. Torsion tests were conducted in the range 278-467 deg. C, and at two strain rates, 2.1 and 4.5 s{sup -1}. Electron backscatter diffraction (EBSD) was employed to characterize the microtexture and microstructure before and after testing. The microstructural evolution during torsion deformation at different temperatures and strain rate conditions determines the mechanical properties at room temperature of the Al 2024 alloy since grain refining, dynamic precipitation and precipitate coalescence occur during the torsion test. These mechanical properties were measured by Vickers microhardness tests. At 408 deg. C and 2.1 s{sup -1} the optimum combination of solid solution and incipient precipitation gives rise to maximum ductility and large fraction of fine and misoriented grains (f{sub HAB} = 54%). In contrast, the increase in test temperature to 467 deg. C produces a sharp decrease in ductility, attributed to the high proportion of alloying elements in solid solution. Both the stress-strain flow curves obtained by torsion tests and the final microstructures are a consequence of recovery phenomena and the dynamic nature of the precipitation process taking place during deformation.

Microstructural characterization by electron backscatter diffraction of a hot worked Al-Cu-Mg alloy

International Nuclear Information System (INIS)

Cepeda-Jimenez, C.M.; Hidalgo, P.; Carsi, M.; Ruano, O.A.; Carreno, F.

2011-01-01

Research highlights: → The most favourable conditions for hot workability have been determined. → EBSD was employed to characterize the obtained microtexture and microstructure. → The Al 2024 alloy torsion tested at 408 deg. C and 2.1 s -1 showed maximum ductility. → Solid solution and fine precipitates favour a fine microstructure at 408 deg. C. → The increase in test temperature to 467 deg. C produces a sharp decrease in ductility. - Abstract: Hot torsion tests to fracture to simulate thermomechanical processing were carried out on a solution-treated Al-Cu-Mg alloy (Al 2024-T351) at constant temperature. Torsion tests were conducted in the range 278-467 deg. C, and at two strain rates, 2.1 and 4.5 s -1 . Electron backscatter diffraction (EBSD) was employed to characterize the microtexture and microstructure before and after testing. The microstructural evolution during torsion deformation at different temperatures and strain rate conditions determines the mechanical properties at room temperature of the Al 2024 alloy since grain refining, dynamic precipitation and precipitate coalescence occur during the torsion test. These mechanical properties were measured by Vickers microhardness tests. At 408 deg. C and 2.1 s -1 the optimum combination of solid solution and incipient precipitation gives rise to maximum ductility and large fraction of fine and misoriented grains (f HAB = 54%). In contrast, the increase in test temperature to 467 deg. C produces a sharp decrease in ductility, attributed to the high proportion of alloying elements in solid solution. Both the stress-strain flow curves obtained by torsion tests and the final microstructures are a consequence of recovery phenomena and the dynamic nature of the precipitation process taking place during deformation.

Analytical purpose electron backscattering system

International Nuclear Information System (INIS)

Desdin, L.; Padron, I.; Laria, J.

1996-01-01

In this work an analytical purposes electron backscattering system improved at the Center of Applied Studies for Nuclear Development is described. This system can be applied for fast, exact and nondestructive testing of binary and AL/Cu, AL/Ni in alloys and for other applications

A correlative approach to segmenting phases and ferrite morphologies in transformation-induced plasticity steel using electron back-scattering diffraction and energy dispersive X-ray spectroscopy

Energy Technology Data Exchange (ETDEWEB)

Gazder, Azdiar A., E-mail: azdiar@uow.edu.au [Electron Microscopy Centre, University of Wollongong, New South Wales 2500 (Australia); Al-Harbi, Fayez; Spanke, Hendrik Th. [School of Mechanical, Materials and Mechatronic Engineering, University of Wollongong, New South Wales 2522 (Australia); Mitchell, David R.G. [Electron Microscopy Centre, University of Wollongong, New South Wales 2500 (Australia); Pereloma, Elena V. [Electron Microscopy Centre, University of Wollongong, New South Wales 2500 (Australia); School of Mechanical, Materials and Mechatronic Engineering, University of Wollongong, New South Wales 2522 (Australia)

2014-12-15

Using a combination of electron back-scattering diffraction and energy dispersive X-ray spectroscopy data, a segmentation procedure was developed to comprehensively distinguish austenite, martensite, polygonal ferrite, ferrite in granular bainite and bainitic ferrite laths in a thermo-mechanically processed low-Si, high-Al transformation-induced plasticity steel. The efficacy of the ferrite morphologies segmentation procedure was verified by transmission electron microscopy. The variation in carbon content between the ferrite in granular bainite and bainitic ferrite laths was explained on the basis of carbon partitioning during their growth. - Highlights: • Multi-condition segmentation of austenite, martensite, polygonal ferrite and ferrite in bainite. • Ferrites in granular bainite and bainitic ferrite segmented by variation in relative carbon counts. • Carbon partitioning during growth explains variation in carbon content of ferrites in bainites. • Developed EBSD image processing tools can be applied to the microstructures of a variety of alloys. • EBSD-based segmentation procedure verified by correlative TEM results.

Measuring the Shock Stage of Asteroid Regolith Grains by Electron Back-Scattered Diffraction

Science.gov (United States)

Zolensky, Michael; Martinez, James; Sitzman, Scott; Mikouchi, Takashi; Hagiya, Kenji; Ohsumi, Kazumasa; Terada, Yasuko; Yagi, Naoto; Komatsu, Mutsumi; Ozawa, Hikaru;

Three-dimensional characterization of bainitic microstructures in low-carbon high-strength low-alloy steel studied by electron backscatter diffraction

International Nuclear Information System (INIS)

Kang, J.S.; Seol, Jae-Bok; Park, C.G.

2013-01-01

We investigated the microstructural evolution of high strength low alloy steel, Fe–2.0Mn–0.15Si–0.05C (wt.%), by varying the continuous cooling rates from 1 K/s to 50 K/s using three-dimensional electron backscatter diffraction and transmission electron microscopy. Granular bainitic microstructure was prevalent under a slow cooling rate of 1–10 K/s, while lath-type bainite was dominant at a high cooling rate of 50 K/s. The acicular ferrite that was the major microstructure under the intermediate ranges of cooling rates between 10 K/s and 30 K/s was tangled with each other, leading to a three-dimensional interwoven structure with highly misoriented grains. Because of the formation of three-dimensional structures, we propose that the terms “acicular ferrite” and “bainitic ferrite,” which are currently used in steel, be replaced by the terms “interwoven acicular bainite” and “lath bainite,” respectively. Moreover, we also confirmed that the cooling rate is an important factor in determining whether bainitic microstructures occur in the form of granular bainite, interwoven bainite, or lath bainite. - Highlights: • The morphology of bainitic grains was characterized by 3D-EBSD. • The ‘interwoven bainite’ and ‘lath bainite’ were suggested. • Interwoven bainite consisted of lenticular plates that were interlinked in 3D regime. • The packets of lath bainite were aligned in a specific direction

Three-dimensional characterization of bainitic microstructures in low-carbon high-strength low-alloy steel studied by electron backscatter diffraction

Energy Technology Data Exchange (ETDEWEB)

Kang, J.S. [Department of Materials Science and Engineering, POSTECH, Pohang 790-784 (Korea, Republic of); Technical Research Laboratories, POSCO, Pohang 790-300 (Korea, Republic of); Seol, Jae-Bok, E-mail: j.seol@mpie.de [Max-Planck-Institut für Eisenforschung, Max-Planck-Str. 1, D-40237 Düsseldorf (Germany); Park, C.G. [Department of Materials Science and Engineering, POSTECH, Pohang 790-784 (Korea, Republic of)

2013-05-15

We investigated the microstructural evolution of high strength low alloy steel, Fe–2.0Mn–0.15Si–0.05C (wt.%), by varying the continuous cooling rates from 1 K/s to 50 K/s using three-dimensional electron backscatter diffraction and transmission electron microscopy. Granular bainitic microstructure was prevalent under a slow cooling rate of 1–10 K/s, while lath-type bainite was dominant at a high cooling rate of 50 K/s. The acicular ferrite that was the major microstructure under the intermediate ranges of cooling rates between 10 K/s and 30 K/s was tangled with each other, leading to a three-dimensional interwoven structure with highly misoriented grains. Because of the formation of three-dimensional structures, we propose that the terms “acicular ferrite” and “bainitic ferrite,” which are currently used in steel, be replaced by the terms “interwoven acicular bainite” and “lath bainite,” respectively. Moreover, we also confirmed that the cooling rate is an important factor in determining whether bainitic microstructures occur in the form of granular bainite, interwoven bainite, or lath bainite. - Highlights: • The morphology of bainitic grains was characterized by 3D-EBSD. • The ‘interwoven bainite’ and ‘lath bainite’ were suggested. • Interwoven bainite consisted of lenticular plates that were interlinked in 3D regime. • The packets of lath bainite were aligned in a specific direction.

Modification of diode characteristics by electron back-scatter from high-atomic-number anodes

International Nuclear Information System (INIS)

Mosher, D.; Cooperstein, G.; Rose, D.V.; Swanekamp, S.B.

1996-01-01

In high-power vacuum diodes with high-atomic-number anodes, back-scattered electrons alter the vacuum space charge and resulting electron and ion currents. Electron multiple back-scattering was studied through equilibrium solutions of the Poisson equation for 1-dimensional, bipolar diodes in order to predict their early-time behavior. Before ion turn-on, back-scattered electrons from high-Z anodes suppress the diode current by about 10%. After ion turn-on in the same diodes, electron back-scatter leads to substantial enhancements of both the electron and ion currents above the Child-Langmuir values. Current enhancements with ion flow from low-Z anodes are small. (author). 5 figs., 7 refs

Modification of diode characteristics by electron back-scatter from high-atomic-number anodes

Energy Technology Data Exchange (ETDEWEB)

Mosher, D; Cooperstein, G [Naval Research Laboratory, Washington, DC (United States); Rose, D V; Swanekamp, S B [JAYCOR, Vienna, VA (United States)

1997-12-31

In high-power vacuum diodes with high-atomic-number anodes, back-scattered electrons alter the vacuum space charge and resulting electron and ion currents. Electron multiple back-scattering was studied through equilibrium solutions of the Poisson equation for 1-dimensional, bipolar diodes in order to predict their early-time behavior. Before ion turn-on, back-scattered electrons from high-Z anodes suppress the diode current by about 10%. After ion turn-on in the same diodes, electron back-scatter leads to substantial enhancements of both the electron and ion currents above the Child-Langmuir values. Current enhancements with ion flow from low-Z anodes are small. (author). 5 figs., 7 refs.

About the information depth of backscattered electron imaging

Czech Academy of Sciences Publication Activity Database

Piňos, Jakub; Mikmeková, Šárka; Frank, Luděk

2017-01-01

Roč. 266, č. 3 (2017), s. 335-342 ISSN 0022-2720 Institutional support: RVO:68081731 Keywords : backscattered electrons * information depth * penetration of electrons Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering OBOR OECD: Materials engineering Impact factor: 1.692, year: 2016

Influence of Plastic Deformation of Steel Samples on the Fast electron Backscattering

International Nuclear Information System (INIS)

Sierra Trujillo, J. X.; Herrera Palma, V.; Desdin Garcia, L. F.; Codorniu Pujals, D.

2013-01-01

A considerable fraction of a fast electron beam incident on a target is scattered in backward direction. It is a very complex process involving electron - nucleus and electron - electron collisions. The fraction of backscattered electrons is described by a parameterization as a function of the atomic number and energy of the incident electrons. In such approaches the possible influence of the material structure is not taken into account. In this paper, the behavior of the 90 Sr/ 90 Y backscattered electrons from 08JuA and 15GJuT steel strained samples is investigated. A clear dependence between the degree of plastic deformation and the fraction of backscattered electrons was observed. This relationship is explained by the interaction of electrons with the dislocations in the material, whose density depends on the magnitude of the strain in the plastic region. On the basis of a simple model for describing this interaction, a mathematical expression is obtained for the relationship between the fraction of backscattered electrons and the degree of deformation. (Author)

Anelasticity of olivine single crystals investigated by stress-reduction tests and high-angular resolution electron backscatter diffraction

Science.gov (United States)

Wallis, D.; Hansen, L. N.; Kempton, I.; Wilkinson, A. J.

2017-12-01

Geodynamic phenomena, including glacial isostatic adjustment and postseismic deformation, can involve transient deformation in response to changes in differential stress acting on mantle rocks. As such, rheological models of transient deformation are incorporated in predictions of associated processes, including sea-level rise and stress redistribution after earthquakes. However, experimental constraints on rheological models for transient deformation of mantle materials are sparse. In particular, experiments involving stress reductions have been lacking. Moreover, a material's response to a reduction in stress can provide clues to the microphysical processes controlling deformation. To constrain models of transient deformation of mantle rocks we performed stress-reduction tests on single crystals of olivine at 1250-1300°C. Mechanical and piezoelectric actuators controlled constant initial stress during creep. At various strain intervals stress was reduced near-instantaneously using the piezoelectric actuator, inducing both elastic and anelastic (time-dependent) lengthening of the samples. A range of magnitudes of stress reduction were applied, typically unloading 10-90% of the initial stress. High-angular resolution electron backscatter diffraction (HR-EBSD), based on cross-correlation of diffraction patterns, was used to map dislocation density and elastic strain distributions in the recovered samples. Magnitudes of anelastic back-strain increase with increasing magnitudes of stress reduction and show a marked increase when stress reductions exceed 50% of the initial stress, consistent with previous observations in metals and alloys. This observation is inconsistent with the Burgers rheological model commonly used to describe transient behaviour and suggests that the style of rheological behaviour depends on the magnitude of stress change. HR-EBSD maps reveal that the crystal lattices are smoothly curved and generally lack subgrain boundaries and elastic strain

Determination of grain boundary mobility during recrystallization by statistical evaluation of electron backscatter diffraction measurements

International Nuclear Information System (INIS)

Basu, I.; Chen, M.; Loeck, M.; Al-Samman, T.; Molodov, D.A.

2016-01-01

One of the key aspects influencing microstructural design pathways in metallic systems is grain boundary motion. The present work introduces a method by means of which direct measurement of grain boundary mobility vs. misorientation dependence is made possible. The technique utilizes datasets acquired by means of serial electron backscatter diffraction (EBSD) measurements. The experimental EBSD measurements are collectively analyzed, whereby datasets were used to obtain grain boundary mobility and grain aspect ratio with respect to grain boundary misorientation. The proposed method is further validated using cellular automata (CA) simulations. Single crystal aluminium was cold rolled and scratched in order to nucleate random orientations. Subsequent annealing at 300 °C resulted in grains growing, in the direction normal to the scratch, into a single deformed orientation. Growth selection was observed, wherein the boundaries with misorientations close to Σ7 CSL orientation relationship (38° 〈111〉) migrated considerably faster. The obtained boundary mobility distribution exhibited a non-monotonic behavior with a maximum corresponding to misorientation of 38° ± 2° about 〈111〉 axes ± 4°, which was 10–100 times higher than the mobility values of random high angle boundaries. Correlation with the grain aspect ratio values indicated a strong growth anisotropy displayed by the fast growing grains. The observations have been discussed in terms of the influence of grain boundary character on grain boundary motion during recrystallization. - Highlights: • Statistical microstructure method to measure grain boundary mobility during recrystallization • Method implementation independent of material or crystal structure • Mobility of the Σ7 boundaries in 5N Al was calculated as 4.7 × 10"–"8 m"4/J ⋅ s. • Pronounced growth selection in the recrystallizing nuclei in Al • Boundary mobility values during recrystallization 2–3 orders of magnitude

Distinguishing Biologically Controlled Calcareous Biomineralization in Fossil Organisms Using Electron Backscatter Diffraction (EBSD)

Science.gov (United States)

Päßler, Jan-Filip; Jarochowska, Emilia; Bestmann, Michel; Munnecke, Axel

2018-02-01

Although carbonate-precipitating cyanobacteria are ubiquitous in aquatic ecosystems today, the criteria used to identify them in the geological record are subjective and rarely testable. Differences in the mode of biomineralization between cyanobacteria and eukaryotes, i.e. biologically induced calcification (BIM) vs. biologically controlled calcification (BCM), result in different crystallographic structures which might be used as a criterion to test cyanobacterial affinities. Cyanobacteria are often used as a ‘wastebasket taxon’, to which various microfossils are assigned. The lack of a testable criterion for the identification of cyanobacteria may bias their fossil record severely. We employed electron backscatter diffraction (EBSD) to investigate the structure of calcareous skeletons in two microproblematica widespread in Palaeozoic marine ecosystems: Rothpletzella, hypothesized to be a cyanobacterium, and an incertae sedis microorganism Allonema. We used a calcareous trilobite shell as a BCM reference. The mineralized structure of Allonema has a simple single-layered structure of acicular crystals perpendicular to the surface of the organism. The c-axes of these crystals are parallel to the elongation and thereby normal to the surface of the organism. EBSD pole figures and misorientation axes distribution reveal a fibre texture around the c-axis with a small degree of variation (up to 30°), indicating a highly ordered structure. A comparable pattern was found in the trilobite shell. This structure allows excluding biologically induced mineralization as the mechanism of shell formation in Allonema. In Rothpletzella, the c-axes of the microcrystalline sheath show a broader clustering compared to Allonema, but still reveal crystals tending to be perpendicular to the surface of the organism. The misorientation axes of adjacent crystals show an approximately random distribution. Rothpletzella also shares morphological similarities with extant cyanobacteria. We

Electron diffraction from carbon nanotubes

International Nuclear Information System (INIS)

Qin, L-C

2006-01-01

The properties of a carbon nanotube are dependent on its atomic structure. The atomic structure of a carbon nanotube can be defined by specifying its chiral indices (u, v), that specify its perimeter vector (chiral vector), with which the diameter and helicity are also determined. The fine electron beam available in a modern transmission electron microscope (TEM) offers a unique probe to reveal the atomic structure of individual nanotubes. This review covers two aspects related to the use of the electron probe in the TEM for the study of carbon nanotubes: (a) to understand the electron diffraction phenomena for inter-pretation of the electron diffraction patterns of carbon nanotubes and (b) to obtain the chiral indices (u, v), of the carbon nanotubes from the electron diffraction patterns. For a nanotube of a given structure, the electron scattering amplitude from the carbon nanotube is first described analytically in closed form using the helical diffraction theory. From a known structure as given by the chiral indices (u, v), its electron diffraction pattern can be calculated and understood. The reverse problem, i.e. assignment of the chiral indices from an electron diffraction pattern of a carbon nanotube, is approached from the relationship between the electron scattering intensity distribution and the chiral indices (u, v). We show that electron diffraction patterns can provide an accurate and unambiguous assignment of the chiral indices of carbon nanotubes. The chiral indices (u, v) can be read indiscriminately with a high accuracy from the intensity distribution on the principal layer lines in an electron diffraction pattern. The symmetry properties of electron diffraction from carbon nanotubes and the electron diffraction from deformed carbon nanotubes are also discussed in detail. It is shown that 2mm symmetry is always preserved for single-walled carbon nanotubes, but it can break down for multiwalled carbon nanotubes under some special circumstances

Evaluation of backscatter dose from internal lead shielding in clinical electron beams using EGSnrc Monte Carlo simulations.

Science.gov (United States)

De Vries, Rowen J; Marsh, Steven

2015-11-08

Internal lead shielding is utilized during superficial electron beam treatments of the head and neck, such as lip carcinoma. Methods for predicting backscattered dose include the use of empirical equations or performing physical measurements. The accuracy of these empirical equations required verification for the local electron beams. In this study, a Monte Carlo model of a Siemens Artiste linac was developed for 6, 9, 12, and 15 MeV electron beams using the EGSnrc MC package. The model was verified against physical measurements to an accuracy of better than 2% and 2mm. Multiple MC simulations of lead interfaces at different depths, corresponding to mean electron energies in the range of 0.2-14 MeV at the interfaces, were performed to calculate electron backscatter values. The simulated electron backscatter was compared with current empirical equations to ascertain their accuracy. The major finding was that the current set of backscatter equations does not accurately predict electron backscatter, particularly in the lower energies region. A new equation was derived which enables estimation of electron backscatter factor at any depth upstream from the interface for the local treatment machines. The derived equation agreed to within 1.5% of the MC simulated electron backscatter at the lead interface and upstream positions. Verification of the equation was performed by comparing to measurements of the electron backscatter factor using Gafchromic EBT2 film. These results show a mean value of 0.997 ± 0.022 to 1σ of the predicted values of electron backscatter. The new empirical equation presented can accurately estimate electron backscatter factor from lead shielding in the range of 0.2 to 14 MeV for the local linacs.

Composition quantification of electron-transparent samples by backscattered electron imaging in scanning electron microscopy

Energy Technology Data Exchange (ETDEWEB)

Müller, E., E-mail: erich.mueller@kit.edu; Gerthsen, D.

2017-02-15

The contrast of backscattered electron (BSE) images in scanning electron microscopy (SEM) depends on material parameters which can be exploited for composition quantification if some information on the material system is available. As an example, the In-concentration in thin In{sub x}Ga{sub 1−x}As layers embedded in a GaAs matrix is analyzed in this work. The spatial resolution of the technique is improved by using thin electron-transparent specimens instead of bulk samples. Although the BSEs are detected in a comparably small angular range by an annular semiconductor detector, the image intensity can be evaluated to determine the composition and local thickness of the specimen. The measured intensities are calibrated within one single image to eliminate the influence of the detection and amplification system. Quantification is performed by comparison of experimental and calculated data. Instead of using time-consuming Monte-Carlo simulations, an analytical model is applied for BSE-intensity calculations which considers single electron scattering and electron diffusion. - Highlights: • Sample thickness and composition are quantified by backscattered electron imaging. • A thin sample is used to achieve spatial resolution of few nanometers. • Calculations are carried out with a time-saving electron diffusion model. • Small differences in atomic number and density detected at low electron energies.

High resolution electron back-scatter diffraction analysis of thermally and mechanically induced strains near carbide inclusions in a superalloy

Energy Technology Data Exchange (ETDEWEB)

Karamched, Phani S., E-mail: phani.karamched@materials.ox.ac.uk [Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH (United Kingdom); Wilkinson, Angus J. [Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH (United Kingdom)

2011-01-15

Cross-correlation-based analysis of electron back-scatter diffraction (EBSD) patterns has been used to obtain high angular resolution maps of lattice rotations and elastic strains near carbides in a directionally solidified superalloy MAR-M-002. Lattice curvatures were determined from the EBSD measurements and used to estimate the distribution of geometrically necessary dislocations (GNDs) induced by the deformation. Significant strains were induced by thermal treatment due to the lower thermal expansion coefficient of the carbide inclusions compared to that of the matrix. In addition to elastic strains the mismatch was sufficient to have induced localized plastic deformation in the matrix leading to a GND density of 3 x 10{sup 13} m{sup -2} in regions around the carbide. Three-point bending was then used to impose strain levels within the range {+-}12% across the height of the bend bar. EBSD lattice curvature measurements were then made at both carbide-containing and carbide-free regions at different heights across the bar. The average GND density increases with the magnitude of the imposed strain (both in tension and compression), and is markedly higher near the carbides particles. The higher GND densities near the carbides (order of 10{sup 14} m{sup -2}) are generated by the large strain gradients produced around the plastically rigid inclusion during mechanical deformation with some minor contribution from the pre-existing residual deformation caused by the thermal mismatch between carbide and nickel matrix.

Analytical expressions for the electron backscattering coefficient

International Nuclear Information System (INIS)

August, H.J.; Wernisch, J.

1989-01-01

Several analytical expressions for the electron backscattering coefficient for massive homogeneous samples are compared with experimental data, directing special attention to the dependence of this quantity on the electron acceleration energy. It is shown that this dependence generally cannot be neglected. The expression proposed by Hunger and Kuechler turns out to be better than that of Love and Scott, although even the better formula can be slightly improved by a small modification. (author)

Characterizing deformed ultrafine-grained and nanocrystalline materials using transmission Kikuchi diffraction in a scanning electron microscope

International Nuclear Information System (INIS)

Trimby, Patrick W.; Cao, Yang; Chen, Zibin; Han, Shuang; Hemker, Kevin J.; Lian, Jianshe; Liao, Xiaozhou; Rottmann, Paul; Samudrala, Saritha; Sun, Jingli; Wang, Jing Tao; Wheeler, John; Cairney, Julie M.

2014-01-01

Graphical abstract: -- Abstract: The recent development of transmission Kikuchi diffraction (TKD) in a scanning electron microscope enables fast, automated orientation mapping of electron transparent samples using standard electron backscatter diffraction (EBSD) hardware. TKD in a scanning electron microscope has significantly better spatial resolution than conventional EBSD, enabling routine characterization of nanocrystalline materials and allowing effective measurement of samples that have undergone severe plastic deformation. Combining TKD with energy dispersive X-ray spectroscopy (EDS) provides complementary chemical information, while a standard forescatter detector system below the EBSD detector can be used to generate dark field and oriented dark field images. Here we illustrate the application of this exciting new approach to a range of deformed, ultrafine grained and nanocrystalline samples, including duplex stainless steel, nanocrystalline copper and highly deformed titanium and nickel–cobalt. The results show that TKD combined with EDS is a highly effective and widely accessible tool for measuring key microstructural parameters at resolutions that are inaccessible using conventional EBSD

Monte Carlo simulation of MOSFET dosimeter for electron backscatter using the GEANT4 code.

Science.gov (United States)

Chow, James C L; Leung, Michael K K

2008-06-01

The aim of this study is to investigate the influence of the body of the metal-oxide-semiconductor field effect transistor (MOSFET) dosimeter in measuring the electron backscatter from lead. The electron backscatter factor (EBF), which is defined as the ratio of dose at the tissue-lead interface to the dose at the same point without the presence of backscatter, was calculated by the Monte Carlo simulation using the GEANT4 code. Electron beams with energies of 4, 6, 9, and 12 MeV were used in the simulation. It was found that in the presence of the MOSFET body, the EBFs were underestimated by about 2%-0.9% for electron beam energies of 4-12 MeV, respectively. The trend of the decrease of EBF with an increase of electron energy can be explained by the small MOSFET dosimeter, mainly made of epoxy and silicon, not only attenuated the electron fluence of the electron beam from upstream, but also the electron backscatter generated by the lead underneath the dosimeter. However, this variation of the EBF underestimation is within the same order of the statistical uncertainties as the Monte Carlo simulations, which ranged from 1.3% to 0.8% for the electron energies of 4-12 MeV, due to the small dosimetric volume. Such small EBF deviation is therefore insignificant when the uncertainty of the Monte Carlo simulation is taken into account. Corresponding measurements were carried out and uncertainties compared to Monte Carlo results were within +/- 2%. Spectra of energy deposited by the backscattered electrons in dosimetric volumes with and without the lead and MOSFET were determined by Monte Carlo simulations. It was found that in both cases, when the MOSFET body is either present or absent in the simulation, deviations of electron energy spectra with and without the lead decrease with an increase of the electron beam energy. Moreover, the softer spectrum of the backscattered electron when lead is present can result in a reduction of the MOSFET response due to stronger

Damage Assessment of Heat Resistant Steels through Electron BackScatter Diffraction Strain Analysis under Creep and Creep-Fatigue Conditions

Science.gov (United States)

Fujiyama, Kazunari; Kimachi, Hirohisa; Tsuboi, Toshiki; Hagiwara, Hiroyuki; Ogino, Shotaro; Mizutani, Yoshiki

EBSD(Electron BackScatter Diffraction) analyses were conducted for studying the quantitative microstructural metrics of creep and creep-fatigue damage for austenitic SUS304HTB boiler tube steel and ferritic Mod.9Cr piping steel. KAM(Kernel Average Misorientation) maps and GOS(Grain Orientation Spread) maps were obtained for these samples and the area averaged values KAMave and GOSave were obtained. While the increasing trends of these misorientation metrics were observed for SUS304HTB steel, the decreasing trends were observed for damaged Mod.9Cr steel with extensive recovery of subgrain structure. To establish more universal parameter representing the accumulation of damage to compensate these opposite trends, the EBSD strain parameters were introduced for converting the misorientation changes into the quantities representing accumulated permanent strains during creep and creep-fatigue damage process. As KAM values were dependent on the pixel size (inversely proportional to the observation magnification) and the permanent strain could be expressed as the shear strain which was the product of dislocation density, Burgers vector and dislocation movement distance, two KAM strain parameters MεKAMnet and MεδKAMave were introduced as the sum of product of the noise subtracted KAMnet and the absolute change from initial value δKAMave with dislocation movement distance divided by pixel size. MεδKAMave parameter showed better relationship both with creep strain in creep tests and accumulated creep strain range in creep-fatigue tests. This parameter can be used as the strain-based damage evaluation and detector of final failure.

The ELSA laser beamline for electron polarization measurements via Compton backscattering

Energy Technology Data Exchange (ETDEWEB)

Switka, Michael; Hinterkeuser, Florian; Koop, Rebecca; Hillert, Wolfgang [Electron Stretcher Facility ELSA, Physics Institute of Bonn University (Germany)

2016-07-01

The Electron Stretcher Facility ELSA provides a spin polarized electron beam with energies of 0.5 - 3.2 GeV for double polarization hadron physics experiments. As of 2015, the laser beamline of the polarimeter based on Compton backscattering restarted operation. It consists of a cw disk laser with design total beam power of 40 W and features two polarized 515 nm photon beams colliding head-on with the stored electron beam in ELSA. The polarization measurement is based on the vertical profile asymmetry of the back-scattered photons, which is dependent on the polarization degree of the stored electron beam. After recent laser repairs, beamline and detector modifications, the properties of the beamline have been determined and first measurements of the electron polarization degree were conducted. The beamline performance and first measurements are presented.

A multislice theory of electron scattering in crystals including backscattering and inelastic effects.

Science.gov (United States)

Spiegelberg, Jakob; Rusz, Ján

2015-12-01

In the framework of the slice transition operator technique, a general multislice theory for electron scattering in crystals is developed. To achieve this generalization, we combine the approaches for inelastic scattering derived by Yoshioka [J. Phys. Soc. Jpn. 12, 6 (1957)] and backscattering based on the formalism of Chen and Van Dyck [Ultramicroscopy 70, 29-44 (1997)]. A computational realization of the obtained equations is suggested. The proposed computational scheme is tested on elastic backscattering of electrons, where we consider single backscattering in analogy to the computational scheme proposed by Chen and Van Dyck. Copyright © 2015 Elsevier B.V. All rights reserved.

Validation Test of Geant4 Simulation of Electron Backscattering

CERN Document Server

Kim, Sung Hun; Basaglia, Tullio; Han, Min Cheol; Hoff, Gabriela; Kim, Chan Hyeong; Saracco, Paolo

2015-01-01

Backscattering is a sensitive probe of the accuracy of electron scattering algorithms implemented in Monte Carlo codes. The capability of the Geant4 toolkit to describe realistically the fraction of electrons backscattered from a target volume is extensively and quantitatively evaluated in comparison with experimental data retrieved from the literature. The validation test covers the energy range between approximately 100 eV and 20 MeV, and concerns a wide set of target elements. Multiple and single electron scattering models implemented in Geant4, as well as preassembled selections of physics models distributed within Geant4, are analyzed with statistical methods. The evaluations concern Geant4 versions from 9.1 to 10.1. Significant evolutions are observed over the range of Geant4 versions, not always in the direction of better compatibility with experiment. Goodness-of-fit tests complemented by categorical analysis tests identify a configuration based on Geant4 Urban multiple scattering model in Geant4 vers...

Acquisition parameters optimization of a transmission electron forward scatter diffraction system in a cold-field emission scanning electron microscope for nanomaterials characterization.

Science.gov (United States)

Brodusch, Nicolas; Demers, Hendrix; Trudeau, Michel; Gauvin, Raynald

2013-01-01

Transmission electron forward scatter diffraction (t-EFSD) is a new technique providing crystallographic information with high resolution on thin specimens by using a conventional electron backscatter diffraction (EBSD) system in a scanning electron microscope. In this study, the impact of tilt angle, working distance, and detector distance on the Kikuchi pattern quality were investigated in a cold-field emission scanning electron microscope (CFE-SEM). We demonstrated that t-EFSD is applicable for tilt angles ranging from -20° to -40°. Working distance (WD) should be optimized for each material by choosing the WD for which the EBSD camera screen illumination is the highest, as the number of detected electrons on the screen is directly dependent on the scattering angle. To take advantage of the best performances of the CFE-SEM, the EBSD camera should be close to the sample and oriented towards the bottom to increase forward scattered electron collection efficiency. However, specimen chamber cluttering and beam/mechanical drift are important limitations in the CFE-SEM used in this work. Finally, the importance of t-EFSD in materials science characterization was illustrated through three examples of phase identification and orientation mapping. © Wiley Periodicals, Inc.

High-energy electron diffraction and microscopy

CERN Document Server

Peng, L M; Whelan, M J

2011-01-01

This book provides a comprehensive introduction to high energy electron diffraction and elastic and inelastic scattering of high energy electrons, with particular emphasis on applications to modern electron microscopy. Starting from a survey of fundamental phenomena, the authors introduce the most important concepts underlying modern understanding of high energy electron diffraction. Dynamical diffraction in transmission (THEED) and reflection (RHEED) geometries is treated using ageneral matrix theory, where computer programs and worked examples are provided to illustrate the concepts and to f

Electron Backscatter Diffraction (EBSD) Analysis and U-Pb Geochronology of the Oldest Lunar Zircon: Constraining Early Lunar Differentiation and Dating Impact-Related Deformation

Science.gov (United States)

Timms, Nick; Nemchin, Alexander; Grange, Marion; Reddy, Steve; Pidgeon, Bob; Geisler, Thorsten; Meyer, Chuck

2009-01-01

The evolution of the early moon was dominated by two processes (i) crystallization of the Lunar Magma Ocean (LMO) and differentiation of potassium-rare earth element-phosphorous-rich residual magma reservoir referred to as KREEP, and (ii) an intense meteorite bombardment referred to as lunar cataclysm . The exact timing of these processes is disputed, and resolution relies on collection and interpretation of precise age data. This study examines the microstructure and geochronology of zircon from lunar impact breccias collected during the Apollo 17 mission. A large zircon clast within lunar breccia 72215,195 shows sector zoning in optical microscopy, cathodoluminescence (CL) imaging and Raman mapping, and indicates that it was a relict fragment of a much larger magmatic grain. Sensitive high resolution ion microprobe (SHRIMP) U-Pb analysis of the zircon shows that U and Th concentration correlate with sector zoning, with darkest CL domains corresponding with high-U and Th (approx.150 and approx.100 ppm respectively), and the brightest-CL sectors containing approx.30-50 ppm U and approx.10-20 ppm Th. This indicates that variations in optical CL and Raman properties correspond to differential accumulation of alpha-radiation damage in each sector. Electron backscatter diffraction (EBSD) mapping shows that the quality of electron backscatter patterns (band contrast) varies with sector zoning, with the poorest quality patterns obtained from high-U and Th, dark-CL zones. EBSD mapping also reveals a deformation microstructure that is cryptic in optical, CL and Raman imaging. Two orthogonal sets of straight discrete and gradational low-angle boundaries accommodate approx.12 misorientation across the grain. The deformation bands are parallel to the crystallographic {a}-planes of the zircon, have misorientation axes parallel to the c-axis, and are geometrically consistent with formation by dislocation creep associated with {010} slip. The deformation bands are unlike curved

A study of the breakdown of Friedel's law in electron backscatter Kikuchi diffraction patterns: Application to zincblende-type structures

International Nuclear Information System (INIS)

Baba-Kishi, K.Z.

1991-01-01

The breakdown of Friedel's law has been observed in backscatter Kikuchi diffraction patterns (BKDP) obtained in the scanning electron microscope (SEM) from a series of zincblende structures including GaAs, InP, GaSb, CdHgTe and the minerals sphalerite (ZnS), chalcopyrite (CuFeS 2 ) and tetrahedrite (Cu 12 Sb 4 S 13 ). Differences in intensities were observed between the reflections 11anti 1 and 5anti 1anti 1 in InP, GaSb, CdHgTe and sphalerite, thus allowing the non-centrosymmetric point group anti 43 m to be determined. In GaAs, differences in intensities were noted between anti 511 and anti 5anti 11. In chalcopyrite and tetrahedrite, non-equivalent intensities were observed between anti 215 and 2anti 1anti 5 and between 3anti 1anti 2 and 31anti 2, respectively. In addition, BKDPs obtained from chalcopyrite revealed a small displacement at the point where the pair of equivalent reflections anti 406 and 460 intersect within the Kikuchi band 02anti 2. The presence of this displacement together with observation of the breakdown of Friedel's law confirmed the tetragonal point group anti 42m for chalcopyrite. Although the point groups of GaAs, chalcopyrite and tetrahedrite were derived successfully using BKDPs, determination of their space groups proved unsuccessful. The superstructure reflections were invisible because the structure factors are very small. The behaviour of the invisible 200 reflection in GaAs is investigated using many-beam dynamical intensity profiles calculated across the h00 systematic row of reflections. Dynamical intensity profiles calculated across the h00 systematic rows of reflections for Ge, InP and sphalerite are also discussed. (orig.)

Quantitative Test of the Evolution of Geant4 Electron Backscattering Simulation

CERN Document Server

Basaglia, Tullio; Hoff, Gabriela; Kim, Chan Hyeong; Kim, Sung Hun; Pia, Maria Grazia; Saracco, Paolo

2016-01-01

Evolutions of Geant4 code have affected the simulation of electron backscattering with respect to previously published results. Their effects are quantified by analyzing the compatibility of the simulated electron backscattering fraction with a large collection of experimental data for a wide set of physics configuration options available in Geant4. Special emphasis is placed on two electron scattering implementations first released in Geant4 version 10.2: the Goudsmit-Saunderson multiple scattering model and a single Coulomb scattering model based on Mott cross section calculation. The new Goudsmit-Saunderson multiple scattering model appears to perform equally or less accurately than the model implemented in previous Geant4 versions, depending on the electron energy. The new Coulomb scattering model was flawed from a physics point of view, but computationally fast in Geant4 version 10.2; the physics correction released in Geant4 version 10.2p01 severely degrades its computational performance. Evolutions in ...

Diffraction of high energy electrons

International Nuclear Information System (INIS)

Bourret, A.

1981-10-01

The diffraction of electrons by a crystal is examined to study its structure. As the electron-substance interaction is strong, it must be treated in a dynamic manner. Using the N waves theory and physical optics the base equations giving the wave at the outlet are deduced for a perfect crystal and their equivalence is shown. The more complex case of an imperfect crystal is then envisaged in these two approaches. In both cases, only the diffraction of high energy electrons ( > 50 KeV) are considered since in the diffraction of slow electrons back scattering cannot be ignored. Taking into account an increasingly greater number of beams, through fast calculations computer techniques, enables images to be simulated in very varied conditions. The general use of the Fast Fourier Transform has given a clear cut practical advantage to the multi-layer method [fr

Electron backscatter diffraction study of deformation and recrystallization textures of individual phases in a cross-rolled duplex steel

Energy Technology Data Exchange (ETDEWEB)

Zaid, Md; Bhattacharjee, P.P., E-mail: pinakib@iith.ac.in

2014-10-15

The evolution of microstructure and texture during cross-rolling and annealing was investigated by electron backscatter diffraction in a ferritic–austenitic duplex stainless steel. For this purpose an alloy with nearly equal volume fraction of the two phases was deformed by multi-pass cross-rolling process up to 90% reduction in thickness. The rolling and transverse directions were mutually interchanged in each pass by rotating the sample by 90° around the normal direction. In order to avoid deformation induced phase transformation and dynamic strain aging, the rolling was carried out at an optimized temperature of 898 K (625 °C) at the warm-deformation range. The microstructure after cross warm-rolling revealed a lamellar structure with alternate arrangement of the bands of two phases. Strong brass and rotated brass components were observed in austenite in the steel after processing by cross warm-rolling. The ferrite in the cross warm-rolling processed steel showed remarkably strong RD-fiber (RD//< 011 >) component (001)< 011 >. The development of texture in the two phases after processing by cross warm-rolling could be explained by the stability of the texture components. During isothermal annealing of the 90% cross warm-rolling processed material the lamellar morphology was retained before collapse of the lamellar structure to the mutual interpenetration of the phase bands. Ferrite showed recovery resulting in annealing texture similar to the deformation texture. In contrast, the austenite showed primary recrystallization without preferential orientation selection leading to the retention of deformation texture. The evolution of deformation and annealing texture in the two phases of the steel was independent of one another. - Highlights: • Effect of cross warm-rolling on texture formation is studied in duplex steel. • Brass texture in austenite and (001)<110 > in ferrite are developed. • Ferrite shows recovery during annealing retaining the (001

Damage measurement of structural material by electron backscatter diffraction. Quantification of measurement quality toward standardization of measurement procedure

International Nuclear Information System (INIS)

Kamaya, Masayuki

2011-01-01

Several attempts have been made to assess the damage induced in materials by crystal orientation distributions identified using electron backscatter diffraction (EBSD). In particular, the local misorientation, which is the misorientation between neighboring measurement points, was shown to correlate well with the degree of material damage such as plastic strain, fatigue and creep. However, the damage assessments conducted using the local misorientations were qualitative rather than quantitative. The local misorientation can be correlated theoretically with physical parameters such as dislocation density. However, the error in crystal orientation measurements makes quantitative evaluation of the local misorientation difficult. Furthermore, the local misorientation depends on distance between the measurement points (step size). For a quantitative assessment of the local misorientation, the error in the crystal orientation measurements must be reduced or the degree of error must be shown quantitatively. In this study, first, the influence of the quality of measurements (accuracy of measurements) and step size on the local misorientation was investigated using stainless steel specimens damaged by tensile deformation or fatigue. By performing the crystal orientation measurements with different conditions, it was shown that the quality of measurement could be represented by the error index, which was previously proposed by the author. Secondly, a filtering process was applied in order to improve the accuracy of crystal orientation measurements and its effect was investigated using the error index. It was revealed that the local misorientations obtained under different measurement conditions could be compared quantitatively only when the error index and the step size were almost or exactly the same. It was also shown that the filtering process could successfully reduce the measurement error and step size dependency of the local misorientations. By applying the filtering

Monte Carlo simulation of Tabata's electron backscattering experiments

International Nuclear Information System (INIS)

Kirihara, Y.; Namito, Y.; Iwase, H.; Hirayama, H.

2010-01-01

Electron backscattering coefficients, η, obtained from several targets in the MeV range were calculated by using electron-photon Monte Carlo transport calculation codes, i.e., EGS5 and ITS 3.0. These calculated values were compared with those obtained from the electron backscattering experiment performed by Tabata using an ionization chamber . We found that Tabata's estimation of the multiplication factor of the ionization chamber, f, had a non-negligible error. Then, we calculated the ionization chamber output, I, which is a product of η and f. The ratios of I between the experimental and the calculated values were within 1.5 and 1.3 for the EGS5 code and the ITS 3.0 code, respectively. The ratios of η between the experimental and the calculated values were within 2.4 and 1.5 for the EGS5 code and the ITS 3.0 code, respectively. The differences between the experimental and the calculated values of I and η are large for low-Z targets (Be and C). Here, the ratios obtained by using the ITS 3.0 code are closer to unity than those obtained by using the EGS5 code. The reason of this is the fact that the calculated value obtained by using the ITS 3.0 code is underestimated for low-Z targets; this underestimation can, in turn, be attributed to the use of the default value of the number of steps in the electron transport algorithm in the ITS 3.0 code.

Interference phenomena at backscattering by ice crystals of cirrus clouds.

Science.gov (United States)

Borovoi, Anatoli; Kustova, Natalia; Konoshonkin, Alexander

2015-09-21

It is shown that light backscattering by hexagonal ice crystals of cirrus clouds is formed within the physical-optics approximation by both diffraction and interference phenomena. Diffraction determines the angular width of the backscattering peak and interference produces the interference rings inside the peak. By use of a simple model for distortion of the pristine hexagonal shape, we show that the shape distortion leads to both oscillations of the scattering (Mueller) matrix within the backscattering peak and to a strong increase of the depolarization, color, and lidar ratios needed for interpretation of lidar signals.

Uniting Electron Crystallography and Powder Diffraction

CERN Document Server

Shankland, Kenneth; Meshi, Louisa; Avilov, Anatoly; David, William

2012-01-01

The polycrystalline and nanocrystalline states play an increasingly important role in exploiting the properties of materials, encompassing applications as diverse as pharmaceuticals, catalysts, solar cells and energy storage. A knowledge of the three-dimensional atomic and molecular structure of materials is essential for understanding and controlling their properties, yet traditional single-crystal X-ray diffraction methods lose their power when only polycrystalline and nanocrystalline samples are available. It is here that powder diffraction and single-crystal electron diffraction techniques take over, substantially extending the range of applicability of the crystallographic principles of structure determination.  This volume, a collection of teaching contributions presented at the Crystallographic Course in Erice in 2011, clearly describes the fundamentals and the state-of-the-art of powder diffraction and electron diffraction methods in materials characterisation, encompassing a diverse range of discipl...

Atomic resolution three-dimensional electron diffraction microscopy

International Nuclear Information System (INIS)

Miao Jianwei; Ohsuna, Tetsu; Terasaki, Osamu; Hodgson, Keith O.; O'Keefe, Michael A.

2002-01-01

We report the development of a novel form of diffraction-based 3D microscopy to overcome resolution barriers inherent in high-resolution electron microscopy and tomography. By combining coherent electron diffraction with the oversampling phasing method, we show that the 3D structure of a nanocrystal can be determined ab initio at a resolution of 1 Angstrom from 29 simulated noisy diffraction patterns. This new form of microscopy can be used to image the 3D structures of nanocrystals and noncrystalline samples, with resolution limited only by the quality of sample diffraction

Critical voltage effects in electron channeling patterns

International Nuclear Information System (INIS)

Farrow, R.C.

1984-01-01

Electron channeling patterns were used to study critical voltage effects in the metals molybdenum and tungsten. The purpose was to characterize both theoretically and experimentally how a critical voltage will affect the channeling pattern line shapes. The study focused on the second order critical voltage that results from the degeneracy between the Bloch wave states of the (110) and (220) reflections. Theoretical (110) series electron channeling pattern line profiles were calculated using the dynamical theory of Hirsch and Humphreys (1970). A 10 beam dynamical electron diffraction calculation was performed (using complex Fourier lattice potentials) to generate Bloch wave coefficients, excitation amplitudes, and absorption coefficients needed for determining backscattering coefficients and subsequent backscattered electron intensities. The theoretical model is applicable to electron diffraction at all energies since no high energy approximation or perturbation method was used

Mineralogical applications of electron diffraction. 1. Theory and techniques

Science.gov (United States)

Ross, Malcolm; Christ, C.L.

1958-01-01

The small wavelengths used in electron-diffraction experiments and the thinness of the crystals necessary for the transmission of the electron beam combine to require a somewhat different diffraction geometry for the interpretation of electron-diffraction patterns than is used in the interpretation of X-ray diffraction patterns. This geometry, based on the reciprocal lattice concept and geometrical construction of Ewald, needed for the interpretation.

Deep-inelastic electron-proton diffraction

International Nuclear Information System (INIS)

Dainton, J.B.

1995-11-01

Recent measurements by the H1 collaboration at HERA of the cross section for deep-inelastic electron-proton scattering in which the proton interacts with minimal energy transfer and limited 4-momentum transfer squared are presented in the form of the contribution F 2 D(3) to the proton structure function F 2 . By parametrising the cross section phenomenologically in terms of a leading effective Regge pole exchange and comparing the result with a similar parametrisation of hadronic pp physics, the proton interaction is demonstrated to be dominantly of a diffractive nature. The quantitative interpretation of the parametrisation in terms of the properties of an effective leading Regge pole exchange, the pomeron (IP), shows that there is no evidence for a 'harder' BFKL-motivated IP in such deep-inelastic proton diffraction. The total contribution of proton diffraction to deep-inelastic electron-proton scattering is measured to be ∝10% and to be rather insensitive to Bjorken-x and Q 2 . A first measurement of the partonic structure of diffractive exchange is presented. It is shown to be readily interpreted in terms of the exchange of gluons, and to suggest that the bulk of diffractive momentum transfer is carried by a leading gluon. (orig.)

rf streak camera based ultrafast relativistic electron diffraction.

Science.gov (United States)

Musumeci, P; Moody, J T; Scoby, C M; Gutierrez, M S; Tran, T

2009-01-01

We theoretically and experimentally investigate the possibility of using a rf streak camera to time resolve in a single shot structural changes at the sub-100 fs time scale via relativistic electron diffraction. We experimentally tested this novel concept at the UCLA Pegasus rf photoinjector. Time-resolved diffraction patterns from thin Al foil are recorded. Averaging over 50 shots is required in order to get statistics sufficient to uncover a variation in time of the diffraction patterns. In the absence of an external pump laser, this is explained as due to the energy chirp on the beam out of the electron gun. With further improvements to the electron source, rf streak camera based ultrafast electron diffraction has the potential to yield truly single shot measurements of ultrafast processes.

Hard x-ray monochromator with milli-electron volt bandwidth for high-resolution diffraction studies of diamond crystals

Energy Technology Data Exchange (ETDEWEB)

Stoupin, Stanislav; Shvyd' ko, Yuri; Shu Deming; Khachatryan, Ruben; Xiao, Xianghui; DeCarlo, Francesco; Goetze, Kurt; Roberts, Timothy; Roehrig, Christian; Deriy, Alexey [Advanced Photon Source, Argonne National Laboratory, Illinois 60439 (United States)

2012-02-15

We report on design and performance of a high-resolution x-ray monochromator with a spectral bandwidth of {Delta}E{sub X}{approx_equal} 1.5 meV, which operates at x-ray energies in the vicinity of the backscattering (Bragg) energy E{sub H} = 13.903 keV of the (008) reflection in diamond. The monochromator is utilized for high-energy-resolution diffraction characterization of diamond crystals as elements of advanced x-ray crystal optics for synchrotrons and x-ray free-electron lasers. The monochromator and the related controls are made portable such that they can be installed and operated at any appropriate synchrotron beamline equipped with a pre-monochromator.

Determining the sputter yields of molybdenum in low-index crystal planes via electron backscattered diffraction, focused ion beam and atomic force microscope

Energy Technology Data Exchange (ETDEWEB)

Huang, H.S., E-mail: 160184@mail.csc.com.tw [New Materials Research and Development Department, China Steel Corporation, 1 Chung Kang Road, Hsiao Kang, Kaohsiung 812, Taiwan, ROC (China); Chiu, C.H.; Hong, I.T.; Tung, H.C. [New Materials Research and Development Department, China Steel Corporation, 1 Chung Kang Road, Hsiao Kang, Kaohsiung 812, Taiwan, ROC (China); Chien, F.S.-S. [Department of Physics, Tunghai University, 1727, Sec. 4, Xitun Dist., Taiwan Boulevard, Taichung 407, Taiwan, ROC (China)

2013-09-15

Previous literature has used several monocrystalline sputtering targets with various crystalline planes, respectively, to investigate the variations of the sputter yield of materials in different crystalline orientations. This study presents a method to measure the sputtered yields of Mo for the three low-index planes (100), (110), and (111), through using an easily made polycrystalline target. The procedure was firstly to use electron backscattered diffraction to identify the grain positions of the three crystalline planes, and then use a focused ion beam to perform the micro-milling of each identified grain, and finally the sputter yields were calculated from the removed volumes, which were measured by atomic force microscope. Experimental results showed that the sputter yield of the primary orientations for Mo varied as Y{sub (110)} > Y{sub (100)} > Y{sub (111)}, coincidental with the ranking of their planar atomic packing densities. The concept of transparency of ion in the crystalline substance was applied to elucidate these results. In addition, the result of (110) orientation exhibiting higher sputter yield is helpful for us to develop a Mo target with a higher deposition rate for use in industry. By changing the deformation process from straight rolling to cross rolling, the (110) texture intensity of the Mo target was significantly improved, and thus enhanced the deposition rate. - Highlights: • We used EBSD, FIB and AFM to measure the sputter yields of Mo in low-index planes. • The sputter yield of the primary orientations for Mo varied as Y{sub (110)} > Y{sub (100)} > Y{sub (111)}. • The transparency of ion was used to elucidate the differences in the sputter yield. • We improved the sputter rate of polycrystalline Mo target by adjusting its texture.

Distribution of uranium in kolm. Evidence from backscattered electron imagery

Energy Technology Data Exchange (ETDEWEB)

Parnell, J [Dep. of Geology, Belfast (Northern Ireland)

1985-02-06

The distribution of uranium in kolm from Upper Cambriam alum shales has been studied using backscattered electron imagery, and found to be concentrated in discrete mineral phases. Authigenic minerals in kolm include pyrite, galena, and a cerium-bearing mineral referable to monazite. Uranium occurs within the monazite and generally shows a close relationship with phosphorus. Uranium bearing monazite has also been identified within the host alum shale.

Relativistic electron diffraction at the UCLA Pegasus photoinjector laboratory

Energy Technology Data Exchange (ETDEWEB)

Musumeci, P. [UCLA Department of Physics and Astronomy, 475 Portola Plaza, Los Angeles, CA 90095-1547 (United States)], E-mail: musumeci@physics.ucla.edu; Moody, J.T.; Scoby, C.M. [UCLA Department of Physics and Astronomy, 475 Portola Plaza, Los Angeles, CA 90095-1547 (United States)

2008-10-15

Electron diffraction holds the promise to yield real-time resolution of atomic motion in an easily accessible environment like a university laboratory at a fraction of the cost of fourth-generation X-ray sources. Currently the limit in time-resolution for conventional electron diffraction is set by how short an electron pulse can be made. A very promising solution to maintain the highest possible beam intensity without excessive pulse broadening from space charge effects is to increase the electron energy to the MeV level where relativistic effects significantly reduce the space charge forces. Rf photoinjectors can in principle deliver up to 10{sup 7}-10{sup 8} electrons packed in bunches of {approx}100-fs length, allowing an unprecedented time resolution and enabling the study of irreversible phenomena by single-shot diffraction patterns. The use of rf photoinjectors as sources for ultrafast electron diffraction has been recently at the center of various theoretical and experimental studies. The UCLA Pegasus laboratory, commissioned in early 2007 as an advanced photoinjector facility, is the only operating system in the country, which has recently demonstrated electron diffraction using a relativistic beam from an rf photoinjector. Due to the use of a state-of-the-art ultrashort photoinjector driver laser system, the beam has been measured to be sub-100-fs long, at least a factor of 5 better than what measured in previous relativistic electron diffraction setups. Moreover, diffraction patterns from various metal targets (titanium and aluminum) have been obtained using the Pegasus beam. One of the main laboratory goals in the near future is to fully develop the rf photoinjector-based ultrafast electron diffraction technique with particular attention to the optimization of the working point of the photoinjector in a low-charge ultrashort pulse regime, and to the development of suitable beam diagnostics.

Relativistic electron diffraction at the UCLA Pegasus photoinjector laboratory

International Nuclear Information System (INIS)

Musumeci, P.; Moody, J.T.; Scoby, C.M.

2008-01-01

Electron diffraction holds the promise to yield real-time resolution of atomic motion in an easily accessible environment like a university laboratory at a fraction of the cost of fourth-generation X-ray sources. Currently the limit in time-resolution for conventional electron diffraction is set by how short an electron pulse can be made. A very promising solution to maintain the highest possible beam intensity without excessive pulse broadening from space charge effects is to increase the electron energy to the MeV level where relativistic effects significantly reduce the space charge forces. Rf photoinjectors can in principle deliver up to 10 7 -10 8 electrons packed in bunches of ∼100-fs length, allowing an unprecedented time resolution and enabling the study of irreversible phenomena by single-shot diffraction patterns. The use of rf photoinjectors as sources for ultrafast electron diffraction has been recently at the center of various theoretical and experimental studies. The UCLA Pegasus laboratory, commissioned in early 2007 as an advanced photoinjector facility, is the only operating system in the country, which has recently demonstrated electron diffraction using a relativistic beam from an rf photoinjector. Due to the use of a state-of-the-art ultrashort photoinjector driver laser system, the beam has been measured to be sub-100-fs long, at least a factor of 5 better than what measured in previous relativistic electron diffraction setups. Moreover, diffraction patterns from various metal targets (titanium and aluminum) have been obtained using the Pegasus beam. One of the main laboratory goals in the near future is to fully develop the rf photoinjector-based ultrafast electron diffraction technique with particular attention to the optimization of the working point of the photoinjector in a low-charge ultrashort pulse regime, and to the development of suitable beam diagnostics

Relativistic electron diffraction at the UCLA Pegasus photoinjector laboratory.

Science.gov (United States)

Musumeci, P; Moody, J T; Scoby, C M

2008-10-01

Electron diffraction holds the promise to yield real-time resolution of atomic motion in an easily accessible environment like a university laboratory at a fraction of the cost of fourth-generation X-ray sources. Currently the limit in time-resolution for conventional electron diffraction is set by how short an electron pulse can be made. A very promising solution to maintain the highest possible beam intensity without excessive pulse broadening from space charge effects is to increase the electron energy to the MeV level where relativistic effects significantly reduce the space charge forces. Rf photoinjectors can in principle deliver up to 10(7)-10(8) electrons packed in bunches of approximately 100-fs length, allowing an unprecedented time resolution and enabling the study of irreversible phenomena by single-shot diffraction patterns. The use of rf photoinjectors as sources for ultrafast electron diffraction has been recently at the center of various theoretical and experimental studies. The UCLA Pegasus laboratory, commissioned in early 2007 as an advanced photoinjector facility, is the only operating system in the country, which has recently demonstrated electron diffraction using a relativistic beam from an rf photoinjector. Due to the use of a state-of-the-art ultrashort photoinjector driver laser system, the beam has been measured to be sub-100-fs long, at least a factor of 5 better than what measured in previous relativistic electron diffraction setups. Moreover, diffraction patterns from various metal targets (titanium and aluminum) have been obtained using the Pegasus beam. One of the main laboratory goals in the near future is to fully develop the rf photoinjector-based ultrafast electron diffraction technique with particular attention to the optimization of the working point of the photoinjector in a low-charge ultrashort pulse regime, and to the development of suitable beam diagnostics.

The Harwell back-scattering spectrometer

International Nuclear Information System (INIS)

Windsor, C.G.; Bunce, L.J.; Borcherds, P.H.; Cole, I.; Fitzmaurice, M.; Johnson, D.A.G.; Sinclair, R.N.

1976-01-01

Neutron diffraction spectra in which both high resolution (Δ Q/Q approximately equal to 0.003) and high intensity are maintained up to scattering vectors as high as 30A -1 (sin theta/lambda = 2.5) have been obtained with the back-scattering spectrometer (BSS) recently installed on the Harwell electron linac. The theory behind the spectrometer design is described, and it is shown how the above resolution requirement leads to its basic features of a 12m incident flight path, a 2m scattering flight path and a scattering angle (2theta) acceptance from 165 0 to 175 0 . Examples of the resolution, intensity and background are given. It is shown that the problem of frame overlap may be overcome by using an absorbing filter. (author)

3D invariant embedding model for backscattering electrons applied to materials characterization

International Nuclear Information System (INIS)

Figueroa, C.; Nieva, N.; Heluani, S.P.

2007-01-01

In this work, the results of a 3D model used to describe the fraction of backscattered electrons, together with its energy and angular distributions, are reported. This 3D model is the result of improvements in the Invariant Embedding Approach to Microanalysis (IEAM). Comparisons with experiment show that the theoretical results follow the general trend of experimental data, when parameters (such as atomic number, energy of the impinging electrons and tilted angle) are changed

An analytical model for light backscattering by coccoliths and coccospheres of Emiliania huxleyi.

Science.gov (United States)

Fournier, Georges; Neukermans, Griet

2017-06-26

We present an analytical model for light backscattering by coccoliths and coccolithophores of the marine calcifying phytoplankter Emiliania huxleyi. The model is based on the separation of the effects of diffraction, refraction, and reflection on scattering, a valid assumption for particle sizes typical of coccoliths and coccolithophores. Our model results match closely with results from an exact scattering code that uses complex particle geometry and our model also mimics well abrupt transitions in scattering magnitude. Finally, we apply our model to predict changes in the spectral backscattering coefficient during an Emiliania huxleyi bloom with results that closely match in situ measurements. Because our model captures the key features that control the light backscattering process, it can be generalized to coccoliths and coccolithophores of different morphologies which can be obtained from size-calibrated electron microphotographs. Matlab codes of this model are provided as supplementary material.

Angle selective backscattered electron contrast in the low-voltage scanning electron microscope: Simulation and experiment for polymers

Energy Technology Data Exchange (ETDEWEB)

Wan, Q., E-mail: qwan2@sheffield.ac.uk [Department of Material Science and Engineering, University of Sheffield, Western Bank, Sheffield S10 2TN (United Kingdom); Masters, R.C. [Department of Material Science and Engineering, University of Sheffield, Western Bank, Sheffield S10 2TN (United Kingdom); Lidzey, D. [Department of Physics and Astronomy, University of Sheffield, Western Bank, Sheffield S10 2TN (United Kingdom); Abrams, K.J. [Department of Material Science and Engineering, University of Sheffield, Western Bank, Sheffield S10 2TN (United Kingdom); Dapor, M. [European Centre for Theoretical Studies in Nuclear Physics and Related Areas (ECT-FBK) and Trento Institute for Fundamental Physics and Applications (TIFPA-INFN), via Sommarive 18, I-38123 Trento (Italy); Plenderleith, R.A. [Department of Material Science and Engineering, University of Sheffield, Western Bank, Sheffield S10 2TN (United Kingdom); Rimmer, S. [Department of Chemistry, University of Sheffield, Western Bank, Sheffield S10 2TN (United Kingdom); Claeyssens, F.; Rodenburg, C. [Department of Material Science and Engineering, University of Sheffield, Western Bank, Sheffield S10 2TN (United Kingdom)

2016-12-15

Recently developed detectors can deliver high resolution and high contrast images of nanostructured carbon based materials in low voltage scanning electron microscopes (LVSEM) with beam deceleration. Monte Carlo Simulations are also used to predict under which exact imaging conditions purely compositional contrast can be obtained and optimised. This allows the prediction of the electron signal intensity in angle selective conditions for back-scattered electron (BSE) imaging in LVSEM and compares it to experimental signals. Angle selective detection with a concentric back scattered (CBS) detector is considered in the model in the absence and presence of a deceleration field, respectively. The validity of the model prediction for both cases was tested experimentally for amorphous C and Cu and applied to complex nanostructured carbon based materials, namely a Poly(N-isopropylacrylamide)/Poly(ethylene glycol) Diacrylate (PNIPAM/PEGDA) semi-interpenetration network (IPN) and a Poly(3-hexylthiophene-2,5-diyl) (P3HT) film, to map nano-scale composition and crystallinity distribution by avoiding experimental imaging conditions that lead to a mixed topographical and compositional contrast - Highlights: • An optimised model for nano-scale analysis of beam sensitive materials by LVSEM. • Simulation and separation of composition and topography in a CBS detector. • Selective angle backscattered electron collection for mapping of polymers.

Angle selective backscattered electron contrast in the low-voltage scanning electron microscope: Simulation and experiment for polymers

International Nuclear Information System (INIS)

Wan, Q.; Masters, R.C.; Lidzey, D.; Abrams, K.J.; Dapor, M.; Plenderleith, R.A.; Rimmer, S.; Claeyssens, F.; Rodenburg, C.

2016-01-01

Recently developed detectors can deliver high resolution and high contrast images of nanostructured carbon based materials in low voltage scanning electron microscopes (LVSEM) with beam deceleration. Monte Carlo Simulations are also used to predict under which exact imaging conditions purely compositional contrast can be obtained and optimised. This allows the prediction of the electron signal intensity in angle selective conditions for back-scattered electron (BSE) imaging in LVSEM and compares it to experimental signals. Angle selective detection with a concentric back scattered (CBS) detector is considered in the model in the absence and presence of a deceleration field, respectively. The validity of the model prediction for both cases was tested experimentally for amorphous C and Cu and applied to complex nanostructured carbon based materials, namely a Poly(N-isopropylacrylamide)/Poly(ethylene glycol) Diacrylate (PNIPAM/PEGDA) semi-interpenetration network (IPN) and a Poly(3-hexylthiophene-2,5-diyl) (P3HT) film, to map nano-scale composition and crystallinity distribution by avoiding experimental imaging conditions that lead to a mixed topographical and compositional contrast - Highlights: • An optimised model for nano-scale analysis of beam sensitive materials by LVSEM. • Simulation and separation of composition and topography in a CBS detector. • Selective angle backscattered electron collection for mapping of polymers.

Ultrafast electron diffraction using an ultracold source

Directory of Open Access Journals (Sweden)

M. W. van Mourik

2014-05-01

Full Text Available The study of structural dynamics of complex macromolecular crystals using electrons requires bunches of sufficient coherence and charge. We present diffraction patterns from graphite, obtained with bunches from an ultracold electron source, based on femtosecond near-threshold photoionization of a laser-cooled atomic gas. By varying the photoionization wavelength, we change the effective source temperature from 300 K to 10 K, resulting in a concomitant change in the width of the diffraction peaks, which is consistent with independently measured source parameters. This constitutes a direct measurement of the beam coherence of this ultracold source and confirms its suitability for protein crystal diffraction.

Absorption and backscatter of internal conversion electrons in the measurements of surface contamination of 137Cs

International Nuclear Information System (INIS)

Yunoki, A.; Kawada, Y.; Yamada, T.; Unno, Y.; Sato, Y.; Hino, Y.

2013-01-01

We measured 4π and 2π counting efficiencies for internal conversion electrons (ICEs), gross β-particles and also β-rays alone with various source conditions regarding absorber and backing foil thickness using e-X coincidence technique. Dominant differences regarding the penetration, attenuation and backscattering properties among ICEs and β-rays were revealed. Although the abundance of internal conversion electrons of 137 Cs- 137 Ba is only 9.35%, 60% of gross counts may be attributed to ICEs in worse source conditions. This information will be useful for radionuclide metrology and for surface contamination monitoring. - Highlights: • Counting efficiencies for internal conversion electrons from 137 Cs were measured, and compared with those for β-rays. • Electron-X coincidence technique was employed. • A thin NaI(Tl) scintillation detector was used for X-ray detection. • Backscattering fractions of electrons and beta particles were studied by similar experiments

Structure determination of modulated structures by powder X-ray diffraction and electron diffraction

Czech Academy of Sciences Publication Activity Database

Zhou, Z.Y.; Palatinus, Lukáš; Sun, J.L.

2016-01-01

Roč. 3, č. 11 (2016), s. 1351-1362 ISSN 2052-1553 Institutional support: RVO:68378271 Keywords : electron diffraction * incommensurate structure * powder diffraction Subject RIV: BM - Solid Matter Physics ; Magnetism Impact factor: 4.036, year: 2016

A simple way to obtain backscattered electron images in a scanning transmission electron microscope.

Science.gov (United States)

Tsuruta, Hiroki; Tanaka, Shigeyasu; Tanji, Takayoshi; Morita, Chiaki

2014-08-01

We have fabricated a simple detector for backscattered electrons (BSEs) and incorporated the detector into a scanning transmission electron microscope (STEM) sample holder. Our detector was made from a 4-mm(2) Si chip. The fabrication procedure was easy, and similar to a standard transmission electron microscopy (TEM) sample thinning process based on ion milling. A TEM grid containing particle objects was fixed to the detector with a silver paste. Observations were carried out using samples of Au and latex particles at 75 and 200 kV. Such a detector provides an easy way to obtain BSE images in an STEM. © The Author 2014. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oup.com.

Precession electron diffraction for SiC grain boundary characterization in unirradiated TRISO fuel

International Nuclear Information System (INIS)

Lillo, T.M.; Rooyen, I.J. van; Wu, Y.Q.

2016-01-01

Highlights: • SiC grain orientation determined by TEM-based precession electron diffraction. • Orientation data improved with increasing TEM sample thickness. • Fraction of low angle grain boundaries lower from PED data than EBSD data. • Fractions of high angle and CSL-related boundaries similar to EBSD data. - Abstract: Precession electron diffraction (PED), a transmission electron microscopy-based technique, has been evaluated for the suitability for evaluating grain boundary character in the SiC layer of tristructural isotropic (TRISO) fuel. This work reports the effect of transmission electron microscope (TEM) lamella thickness on the quality of data and establishes a baseline comparison to SiC grain boundary characteristics, in an unirradiated TRISO particle, determined previously using a conventional electron backscatter diffraction (EBSD) scanning electron microscope (SEM)-based technique. In general, it was determined that the lamella thickness produced using the standard focused ion beam (FIB) fabrication process (∼80 nm), is sufficient to provide reliable PED measurements, although thicker lamellae (∼120 nm) were found to produce higher quality orientation data. Also, analysis of SiC grain boundary character from the TEM-based PED data showed a much lower fraction of low-angle grain boundaries compared to SEM-based EBSD data from the SiC layer of a TRISO-coated particle made using the same fabrication parameters and a SiC layer deposited at a slightly lower temperature from a surrogate TRISO particle. However, the fractions of high-angle and coincident site lattice (CSL)-related grain boundaries determined by PED are similar to those found using SEM-based EBSD. Since the grain size of the SiC layer of TRSIO fuel can be as small as 250 nm (Kirchhofer et al., 2013), depending on the fabrication parameters, and since grain boundary fission product precipitates in irradiated TRISO fuel can be nano-sized, the TEM-based PED orientation data

High-efficiency detector of secondary and backscattered electrons for low-dose imaging in the ESEM.

Science.gov (United States)

Neděla, Vilém; Tihlaříková, Eva; Runštuk, Jiří; Hudec, Jiří

2018-01-01

A new Combined System for high-efficiency detection of Secondary and Backscattered Electrons (CSSBE) in the ESEM consists of three detectors: an ionisation SE detector, an improved scintillation BSE detector, and a new Ionisation Secondary Electron Detector with an electrostatic Separator (ISEDS). The ISEDS optimizes conditions for electron-gas ionisation phenomena in the ESEM to achieve a strongly amplified signal from the secondary electrons with a minimal contribution from backscattered and beam electrons. For this purpose, it is originally equipped with an electrostatic separator, which focuses signal electrons towards a detection electrode and controls the concentration of positive ions above the sample. The working principle of the ISEDS is explained by simulations of signal electron trajectories in gas using the EOD program with our Monte Carlo module. The ability to detect the signal electrons in a selected range of energies is described with Geant4 Monte Carlo simulations of electron-solid interactions and proven by experimental results. High-efficiency detection of the ISEDS is demonstrated by imaging a low atomic number sample under a reduced beam energy of 5 keV, very low beam currents of up to 0.2 pA, and gas pressure of hundreds of Pa. Copyright © 2017 Elsevier B.V. All rights reserved.

Direct observation of the hydrogen peak in the energy distribution of electrons backscattered elastically from polyethylene

International Nuclear Information System (INIS)

Varga, D.; Toekesi, K.; Berenyi, Z.; Toth, J.; Koever, L.

2004-01-01

Complete text of publication follows. Observation of the hydrogen peak is either challenging or impossible task for the conventional electron spectroscopy. Hydrogen was observed earlier in electron scattering experiments using transmission geometry and formvar film. In this work we show an alternative way for the detection of hydrogen peak analyzing the spectra of elastically backscattered electrons from polyethylene ((CH 2 ) n ). We take advantage of the fact that the elastic peak from polyethylene split into carbon and hydrogen components. The energy of the elastically scattered electrons is shifted from the nominal values due to the energy transfer between the primary electron and the target atoms (recoil effect). Due to the motion of the scattering atoms, a broadering of the energy width of the spectra takes place. We performed Monte Carlo simulation for 2 keV electrons penetrated and elastically backscattered from polyethylene sample. In our calculations both the elastic and inelastic scattering events were taken into account. We further assume that the thermal motion of the target atoms follows the Maxwell-Boltzmann energy distribution. After each elastic scattering the recoil energy was calculated according to ref Fig. 1 shows the geometric configuration used in the calculation. The initial angle of incident beam (θ) was 50 deg. Fig. 2 shows the gray scale plot of the intensity of electrons backscattered elastically from polyethylene. The separation between the carbon and hydrogen peaks is clearly seen. Our results show that the multiple electron scattering causes only minor changes in the energy shifts and broadenings of elastic peaks. Moreover, our simulations are in good agreement with our experimental observations. (author)

Serial single molecule electron diffraction imaging: diffraction background of superfluid helium droplets

Science.gov (United States)

Zhang, Jie; He, Yunteng; Lei, Lei; Alghamdi, Maha; Oswalt, Andrew; Kong, Wei

2017-08-01

In an effort to solve the crystallization problem in crystallography, we have been engaged in developing a method termed "serial single molecule electron diffraction imaging" (SS-EDI). The unique features of SS-EDI are superfluid helium droplet cooling and field-induced orientation: together the two features constitute a molecular goniometer. Unfortunately, the helium atoms surrounding the sample molecule also contribute to a diffraction background. In this report, we analyze the properties of a superfluid helium droplet beam and its doping statistics, and demonstrate the feasibility of overcoming the background issue by using the velocity slip phenomenon of a pulsed droplet beam. Electron diffraction profiles and pair correlation functions of ferrocene-monomer-doped droplets and iodine-nanocluster-doped droplets are presented. The timing of the pulsed electron gun and the effective doping efficiency under different dopant pressures can both be controlled for size selection. This work clears any doubt of the effectiveness of superfluid helium droplets in SS-EDI, thereby advancing the effort in demonstrating the "proof-of-concept" one step further.

Contribution of back-scattered electromagnetic rays to the Moessbauer conversion electron spectrum

International Nuclear Information System (INIS)

Ruskov, T.; Ruskov, R.; Paneva, D.; Lefterov, D.

1999-01-01

The contribution of back-scattered electromagnetic rays in a 57 Fe conversion electron Moessbauer spectrum is considered using proportional counter as a detector. A simplified method for measuring this contribution is described. The experimental results show that this contribution strongly depends on the construction of the counter and the selected fraction in the pulse-height spectrum

Carbon/Hydrogen ratio determination in hydrocarbons and its mixtures by electron backscattering technique

International Nuclear Information System (INIS)

Padron, I.; Desdin, L.F.; Navarro, A.; Fuentes, M.

1996-01-01

A method carbon/hydrogen ratio (C/H) determination in hydrocarbons and its mixtures was improved using the electron backscattering technique. Besides the hetero atoms (S,O and N) influence in petroleum is studied for being able to determinate the C/H ratio in cuban petroleum with high sulphur contents

Ultrafast electron diffraction with megahertz MeV electron pulses from a superconducting radio-frequency photoinjector

Energy Technology Data Exchange (ETDEWEB)

Feng, L. W.; Lin, L.; Huang, S. L.; Quan, S. W.; Hao, J. K.; Zhu, F.; Wang, F.; Liu, K. X., E-mail: kxliu@pku.edu.cn [Institute of Heavy Ion Physics and State Key Laboratory of Nuclear Physics and Technology, Peking University, Beijing 100871 (China); Jiang, T.; Zhu, P. F.; Fu, F.; Wang, R.; Zhao, L.; Xiang, D., E-mail: dxiang@sjtu.edu.cn [Key Laboratory for Laser Plasmas (Ministry of Education), Department of Physics and Astronomy, Shanghai Jiao Tong University, Shanghai 200240 (China); IFSA Collaborative Innovation Center, Shanghai Jiao Tong University, Shanghai 200240 (China)

2015-11-30

We report ultrafast relativistic electron diffraction operating at the megahertz repetition rate where the electron beam is produced in a superconducting radio-frequency (rf) photoinjector. We show that the beam quality is sufficiently high to provide clear diffraction patterns from gold and aluminium samples. With the number of electrons, several orders of magnitude higher than that from a normal conducting photocathode rf gun, such high repetition rate ultrafast MeV electron diffraction may open up many new opportunities in ultrafast science.

Energy analyzer for Auger electron spectroscopy and low-energy backscattering ion spectroscopy

International Nuclear Information System (INIS)

Volkov, S.S.; Gorelik, V.A.; Gutenko, V.T.; Protopopov, O.D.; Trubitsin, A.A.; Shuvalova, Z.A.; Yakushev, G.A.

1988-01-01

Energy analyzer for electron Auger spectroscopy and low-energy backscattering ion spectroscopy is described. Analyzer presents one-cascade variant of cylindrical mirror with second-order focusing. Energy relative resolution is continuously adjusted within 0.2-1.2% limits. Signal/noise relation by Cu Auger-line at 1 muA current of exciting beam changes upper limit of range 150-450

Calculation and construction of electron-diffraction photographs using computer

International Nuclear Information System (INIS)

Khayurov, S.S.; Notkin, A.B.

1981-01-01

A method of computer construction and indexing of theoretical electronograms for monophase structures with arbitrary type of crystal lattice and for polyphase ones with known orientational coorrelations between phases is presented. Electron-diffraction photograph is presented, obtained from the foil area of two-phase VT22 alloy at β phase orientation in comparison with theoretical electron-diffraction photographs, built ap by computer, with the [100] β phase zone axis and with three variants of α phase orientation relatively to β phase. It is shown that on the experimental electron-diffraction photograph simultaneously presents α-phase three orientations, which reflexes can be indexing correctly [ru

Secondary mineralization in carious lesions of human dentin. Electron-probe, electron microscope, and electron diffraction studies

Energy Technology Data Exchange (ETDEWEB)

Ogiwara, H [Tokyo Dental Coll. (Japan)

1975-02-01

Dentinal carious lesions having a remineralized surface layer were studied by means electron-probe microanalysis, electron microscopy, electron diffraction. As the results of electron-probe study, F, Mg, and Na were found to be distributed mainly in the remineralized surface layer and S in the decalcified region where decreases in Ca, P, and Mg concentration were usually observed. The decrease in Mg concentration always started earlier than that of Ca and P concentration. Electron microscope and electron diffraction studies revealed that apatic crystals in the remineralized surface layer were much larger than those in the intact dentin. Although they were less conspicuous, crystals in the decalcified region also were larger than those in the intact region. Dentinal tubules, occluded by many crystals, were frequently seen during the observations. Crystals in the tubules varied in morphology, showing granular, needle, rhomboid, and tabular shapes. By means of electron diffraction, the granular- or needle-shaped crystals were identified as apatite and the rhomboid-shaped crystals as whitlockite. Some of the tabular-shaped crystals appeared to be cotacalcium phosphate.

Femtosecond electron diffraction. Next generation electron sources for atomically resolved dynamics

Energy Technology Data Exchange (ETDEWEB)

Hirscht, Julian

2015-08-15

Three instruments for femtosecond electron diffraction (FED) experiments were erected, partially commissioned and used for first diffraction experiments. The Relativistic Electron Gun for Atomic Exploration (REGAE) was completed by beamline elements including supports, a specimen chamber and dark current or electron beam collimating elements such that the commissioning process, including first diffraction experiments in this context, could be started. The temporal resolution of this machine is simulated to be 25 fs (fwhm) short, while a transverse coherence length of 30 nm (fwhm) is feasible to resolve proteins on this scale. Whether this machine is capable of meeting these predictions or whether the dynamics of the electron beam will stay limited by accelerator components, is not finally determined by the end of this work, because commissioning and improvement of accelerator components is ongoing. Simultaneously, a compact DC electron diffraction apparatus, the E-Gun 300, designed for solid and liquid specimens and a target electron energy of 300 keV, was built. Fundamental design issues of the high potential carrying and beam generating components occurred and are limiting the maximum potential and electron energy to 120 keV. Furthermore, this is limiting the range of possible applications and consequently the design and construction of a brand new instrument began. The Femtosecond Electron Diffraction CAmera for Molecular Movies (FED-CAMM) bridges the performance problems of very high electric potentials and provides optimal operational conditions for all applied electron energies up to 300 keV. The variability of gap spacings and optimized manufacturing of the high voltage electrodes lead to the best possible electron pulse durations obtainable with a compact DC setup, that does not comprise of rf-structures. This third apparatus possesses pulse durations just a few tenth femtoseconds apart from the design limit of the highly relativistic REGAE and combines the

Femtosecond electron diffraction. Next generation electron sources for atomically resolved dynamics

International Nuclear Information System (INIS)

Hirscht, Julian

2015-08-01

Three instruments for femtosecond electron diffraction (FED) experiments were erected, partially commissioned and used for first diffraction experiments. The Relativistic Electron Gun for Atomic Exploration (REGAE) was completed by beamline elements including supports, a specimen chamber and dark current or electron beam collimating elements such that the commissioning process, including first diffraction experiments in this context, could be started. The temporal resolution of this machine is simulated to be 25 fs (fwhm) short, while a transverse coherence length of 30 nm (fwhm) is feasible to resolve proteins on this scale. Whether this machine is capable of meeting these predictions or whether the dynamics of the electron beam will stay limited by accelerator components, is not finally determined by the end of this work, because commissioning and improvement of accelerator components is ongoing. Simultaneously, a compact DC electron diffraction apparatus, the E-Gun 300, designed for solid and liquid specimens and a target electron energy of 300 keV, was built. Fundamental design issues of the high potential carrying and beam generating components occurred and are limiting the maximum potential and electron energy to 120 keV. Furthermore, this is limiting the range of possible applications and consequently the design and construction of a brand new instrument began. The Femtosecond Electron Diffraction CAmera for Molecular Movies (FED-CAMM) bridges the performance problems of very high electric potentials and provides optimal operational conditions for all applied electron energies up to 300 keV. The variability of gap spacings and optimized manufacturing of the high voltage electrodes lead to the best possible electron pulse durations obtainable with a compact DC setup, that does not comprise of rf-structures. This third apparatus possesses pulse durations just a few tenth femtoseconds apart from the design limit of the highly relativistic REGAE and combines the

A method of combining STEM image with parallel beam diffraction and electron-optical conditions for diffractive imaging

International Nuclear Information System (INIS)

He Haifeng; Nelson, Chris

2007-01-01

We describe a method of combining STEM imaging functionalities with nanoarea parallel beam electron diffraction on a modern TEM. This facilitates the search for individual particles whose diffraction patterns are needed for diffractive imaging or structural studies of nanoparticles. This also lays out a base for 3D diffraction data collection

False colour backscatter electron images and their application during electron microprobe analysis of ores and host rocks

International Nuclear Information System (INIS)

Cousens, D.R.; French, D.H.; Ramsden, A.R.

1989-01-01

The limited contrast range of conventional black and white imaging does not enable full use to be made of the dynamic range of the video signal obtained from a scanning electron microscope or microprobe. The use of false colour substantially increases the information that can be derived from such images enabling relationships to be displayed that cannot be observed in black and white. This capability is now used extensively in combination with quantitative electron microprobe analysis as a research tool for ore characterization and host rocks studies related to minerals exploration in the CSIRO Div.sion of Exploration Geoscience. Thus the CAMEBAX scanning electron microprobe has been modified to allow digital images acquisition and software (IMAGE) developed which allows false colour backscatter electron (BSE) images to be obtained during the course of routine electron microprobe analysis. 1 fig

Diffraction and microscopy with attosecond electron pulse trains

Science.gov (United States)

Morimoto, Yuya; Baum, Peter

2018-03-01

Attosecond spectroscopy1-7 can resolve electronic processes directly in time, but a movie-like space-time recording is impeded by the too long wavelength ( 100 times larger than atomic distances) or the source-sample entanglement in re-collision techniques8-11. Here we advance attosecond metrology to picometre wavelength and sub-atomic resolution by using free-space electrons instead of higher-harmonic photons1-7 or re-colliding wavepackets8-11. A beam of 70-keV electrons at 4.5-pm de Broglie wavelength is modulated by the electric field of laser cycles into a sequence of electron pulses with sub-optical-cycle duration. Time-resolved diffraction from crystalline silicon reveals a propagates in space and time. This unification of attosecond science with electron microscopy and diffraction enables space-time imaging of light-driven processes in the entire range of sample morphologies that electron microscopy can access.

The use of combined three-dimensional electron backscatter diffraction and energy dispersive X-ray analysis to assess the characteristics of the gamma/gamma-prime microstructure in alloy 720Li™

International Nuclear Information System (INIS)

Child, D.J.; West, G.D.; Thomson, R.C.

2012-01-01

Multiple three-dimensional reconstructions of a γ/γ′ phase structure in Alloy 720Li have been carried out by employing a serial milling technique with simultaneous electron backscatter diffraction (EBSD) and energy dispersive x-ray (EDX) analysis data collection. Combining EBSD data with EDX is critical in obtaining maps to distinguish between the chemically differing, but crystallographically similar γ and γ′ phases present in the alloy studied. EDX is shown to allow the differentiation of γ and γ′ phases, with EBSD providing increased grain shape accuracy. The combination of data sources also allowed identification of coherent γ/γ′ phase interfaces that would not be identified using solely EBSD or EDX. The study identifies a region of grain banding within the alloy, which provides the basis for a three-dimensional comparison and discussion of γ′ phase size between coarse and fine grain regions, whilst also identifying coherent γ′ phase interfaces, possible only using both EDX and EBSD systems simultaneously. The majority of the γ′ phase lies in the range of 1–10 μm in non-banded regions, with a detectable particle size limit of 500 nm being established. The validity of the reconstruction has been demonstrated using an electron interaction volumes model, and an assessment of the validity of EBSD and EDX data sources is discussed showing γ′ phase connectivity in all dimensions. -- Highlights: ► Use of combined EBSD/EDX for the 3D analysis of gamma prime in a Ni-based alloy. ► Assessment of 3D reconstruction accuracy using CASINO. ► Observation and validation of gamma prime phase connectivity throughout the alloy. ► Identification and characterisation of grain banding in gamma prime. ► Distinction of phase coherency between gamma and gamma prime.

A measurement of electron-wall interactions using transmission diffraction from nanofabricated gratings

International Nuclear Information System (INIS)

Barwick, Brett; Gronniger, Glen; Yuan, Lu; Liou, Sy-Hwang; Batelaan, Herman

2006-01-01

Electron diffraction from metal coated freestanding nanofabricated gratings is presented, with a quantitative path integral analysis of the electron-grating interactions. Electron diffraction out to the 20th order was observed indicating the high quality of our nanofabricated gratings. The electron beam is collimated to its diffraction limit with ion-milled material slits. Our path integral analysis is first tested against single slit electron diffraction, and then further expanded with the same theoretical approach to describe grating diffraction. Rotation of the grating with respect to the incident electron beam varies the effective distance between the electron and grating bars. This allows the measurement of the image charge potential between the electron and the grating bars. Image charge potentials that were about 15% of the value for that of a pure electron-metal wall interaction were found. We varied the electron energy from 50 to 900 eV. The interaction time is of the order of typical metal image charge response times and in principle allows the investigation of image charge formation. In addition to the image charge interaction there is a dephasing process reducing the transverse coherence length of the electron wave. The dephasing process causes broadening of the diffraction peaks and is consistent with a model that ascribes the dephasing process to microscopic contact potentials. Surface structures with length scales of about 200 nm observed with a scanning tunneling microscope, and dephasing interaction strength typical of contact potentials of 0.35 eV support this claim. Such a dephasing model motivated the investigation of different metallic coatings, in particular Ni, Ti, Al, and different thickness Au-Pd coatings. Improved quality of diffraction patterns was found for Ni. This coating made electron diffraction possible at energies as low as 50 eV. This energy was limited by our electron gun design. These results are particularly relevant for the

Electro-optic sampling for time resolving relativistic ultrafast electron diffraction

International Nuclear Information System (INIS)

Scoby, C. M.; Musumeci, P.; Moody, J.; Gutierrez, M.; Tran, T.

2009-01-01

The Pegasus laboratory at UCLA features a state-of-the-art electron photoinjector capable of producing ultrashort (<100 fs) high-brightness electron bunches at energies of 3.75 MeV. These beams recently have been used to produce static diffraction patterns from scattering off thin metal foils, and it is foreseen to take advantage of the ultrashort nature of these bunches in future pump-probe time-resolved diffraction studies. In this paper, single shot 2-d electro-optic sampling is presented as a potential technique for time of arrival stamping of electron bunches used for diffraction. Effects of relatively low bunch charge (a few 10's of pC) and modestly relativistic beams are discussed and background compensation techniques to obtain high signal-to-noise ratio are explored. From these preliminary tests, electro-optic sampling is suitable to be a reliable nondestructive time stamping method for relativistic ultrafast electron diffraction at the Pegasus lab.

Low-temperature system for simultaneous counting of conversion electrons and backscattered [gamma]-rays in Moessbauer effect experiment

Energy Technology Data Exchange (ETDEWEB)

Ruskov, Todor (Institute for Nuclear Research and Nuclear Energy, Tsarigradsko shosse 72, Sofia 1784 (Bulgaria)); Passage, Guener (Institute for Nuclear Research and Nuclear Energy, Tsarigradsko shosse 72, Sofia 1784 (Bulgaria)); Rastanawi, Abdallah (Institute for Nuclear Research and Nuclear Energy, Tsarigradsko shosse 72, Sofia 1784 (Bulgaria)); Radev, Rumen (Institute for Nuclear Research and Nuclear Energy, Tsarigradsko shosse 72, Sofia 1784 (Bulgaria))

1994-12-01

A system for simultaneous detection of conversion electrons, emitted after resonant exciting of [sup 57]Fe, and resonant backscattered [gamma]-rays and X-rays, accompanying the conversion electrons, is described. The system includes a helium proportional counter, for detection of conversion electrons, and a toroidal ''Keisch-type'' proportional counter, connected to the vacuum part of a helium cryostat. ((orig.))

Backscattered electron imaging at low emerging angles: A physical approach to contrast in LVSEM

Energy Technology Data Exchange (ETDEWEB)

Cazaux, J., E-mail: jacques.cazaux@univ-reims.fr [LISM, EA 4695 Faculty of Sciences, BP 1039, 51687 Reims Cedex 2 (France); Kuwano, N. [Malaysia–Japan International Institute of Technology, Universiti Teknologi Malaysia, Jalan Semarak, 54100 Kuala Lumpur (Malaysia); Sato, K. [Steel Research Laboratory, JFE Steel Corporation, 1 Kawasaki-cho, Chuo-ku, Chiba 260-0835 (Japan)

2013-12-15

Due to the influence of refraction effects on the escape probability of the Back-Scattered Electrons (BSE), an expression of the fraction of these BSE is given as a function of the beam energy, E°, and emission angle (with respect to the normal) α. It has been shown that these effects are very sensitive to a local change of the work function in particular for low emerging angles. This sensitivity suggests a new type of contrast in Low Voltage Scanning Electron Microscopy (LVSEM for E°<2 keV): the work function contrast. Involving the change of ϕ with crystalline orientation, this possibility is supported by a new interpretation of a few published images. Some other correlated contrasts are also suggested. These are topographical contrasts or contrasts due to subsurface particles and cracks. Practical considerations of the detection system and its optimization are indicated. - Highlights: • Refraction effects experienced by Back-Scattered Electrons at sample/vacuum interfaces are evaluated as a function of energy and angles. • Sensitive to local work function changes with crystalline orientation these effects concern mainly keV-electrons at low emerging angles. • A new type of contrast in SEM is thus deduced and illustrated. • Some other correlated contrasts, topographical contrasts or contrasts due to subsurface particles and cracks are also suggested.

Structural studies of glasses by transmission electron microscopy and electron diffraction

International Nuclear Information System (INIS)

Kashchieva, E.P.

1997-01-01

The purpose of this work is to present information about the applications of transmission electron microscopy (TEM) and electron diffraction (ED) for structural investigations of glasses. TEM investigations have been carried out on some binary and on a large number of ternary borate-telluride systems where glass-forming oxides, oxides of transitional elements and modified oxides of elements from I, II and III groups in the periodic table, are used as third component. The large experimental data given by TEM method allows the fine classification of the micro-heterogeneities. A special case of micro-heterogeneous structure with technological origin occurs near the boundary between the 2 immiscible liquids obtained at macro-phase separation. TEM was also used for the direct observation of the glass structure and we have studied the nano-scale structure of borate glasses obtained at slow and fast cooling of the melts. The ED possesses advantages for analysis of amorphous thin films or micro-pastilles and it is a very useful technique for study in materials containing simultaneously light and heavy elements. A comparison between the possibilities of the 3 diffraction techniques (X-ray diffraction, neutron diffraction and ED) is presented

Low-kilovolt coherent electron diffractive imaging instrument based on a single-atom electron source

Energy Technology Data Exchange (ETDEWEB)

Lin, Chun-Yueh [Department of Physics, National Taiwan University, Taipei 10617, Taiwan (China); Chang, Wei-Tse; Chen, Yi-Sheng; Hwu, En-Te; Chang, Chia-Seng; Hwang, Ing-Shouh, E-mail: ishwang@phys.sinica.edu.tw [Institute of Physics, Academia Sinica, Nankang, Taipei 11529, Taiwan (China); Hsu, Wei-Hao [Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan (China)

2016-03-15

In this work, a transmission-type, low-kilovolt coherent electron diffractive imaging instrument was constructed. It comprised a single-atom field emitter, a triple-element electrostatic lens, a sample holder, and a retractable delay line detector to record the diffraction patterns at different positions behind the sample. It was designed to image materials thinner than 3 nm. The authors analyzed the asymmetric triple-element electrostatic lens for focusing the electron beams and achieved a focused beam spot of 87 nm on the sample plane at the electron energy of 2 kV. High-angle coherent diffraction patterns of a suspended graphene sample corresponding to (0.62 Å){sup −1} were recorded. This work demonstrated the potential of coherent diffractive imaging of thin two-dimensional materials, biological molecules, and nano-objects at a voltage between 1 and 10 kV. The ultimate goal of this instrument is to achieve atomic resolution of these materials with high contrast and little radiation damage.

Evaluation of the photon monitor backscatter in medical electron accelerators

International Nuclear Information System (INIS)

Zrenner, M.; Krieger, H.

1999-01-01

Background: Modern linear accelerators permit the use of irregular fields due to their flexible collimator systems with separately movable jaws or multileaf collimators. When using such irregular fields in the clinical practice output factors have to be corrected for enhanced backscatter to the dose monitor as compared with the conventional block shieldings. Methods: A method is presented to detect the monitor backscatter contributions to the output factor for irregular field settings. Results: The monitor backscatter factors have been measured using a telescopic device for 2 different treatment head geometries (Varian Clinac 2100C/D, General Electric Saturne 15) and for 3 photon radiation qualities (nominal energies X6, X18, X12). A method is introduced to calculate the monitor backscatter for arbitrary irregular treatment fields from the experimental data for square or rectangular fields. Conclusions: Besides the corrections for changes in phantom scatter and changes in the aperture, corrections for monitor backscatter have to be taken into account in many clinical cases. They can contribute up to more than 10% compared with the monitor values for free regular fields. (orig.) [de

The Heisenberg Uncertainty Principle Demonstrated with An Electron Diffraction Experiment

Science.gov (United States)

Matteucci, Giorgio; Ferrari, Loris; Migliori, Andrea

2010-01-01

An experiment analogous to the classical diffraction of light from a circular aperture has been realized with electrons. The results are used to introduce undergraduate students to the wave behaviour of electrons. The diffraction fringes produced by the circular aperture are compared to those predicted by quantum mechanics and are exploited to…

Quantitative analysis of the energy distributions of electrons backscattered elastically from polyethylene

International Nuclear Information System (INIS)

Tőkési, K.; Varga, D.; Berényi, Z.

2015-01-01

We present results of theoretical and experimental studies of the spectra of electrons backscattered elastically from polyethylene in the primary energy range between 1 and 5 keV. The experiments were performed using a high energy resolution electron spectroscopy. The theoretical interpretation is based on a Monte Carlo simulation of the recoil and Doppler effects. The separation between the carbon and hydrogen peak in the energy distributions is shown as a function of the primary electron energy. The simulations give many partial distributions separately, depending on the number of elastic scatterings (single, and multiple scatterings of different types). We show our results for intensity ratios, peak shifts and broadenings. We also present detailed analytical calculations for the main parameters of a single scattering. Finally, we present a qualitative comparison with the experimental data. We find our resulting energy distribution of elastically scattered electrons to be in good agreement with our measurements

NIST/Sandia/ICDD Electron Diffraction Database: A Database for Phase Identification by Electron Diffraction.

Science.gov (United States)

Carr, M J; Chambers, W F; Melgaard, D; Himes, V L; Stalick, J K; Mighell, A D

1989-01-01

A new database containing crystallographic and chemical information designed especially for application to electron diffraction search/match and related problems has been developed. The new database was derived from two well-established x-ray diffraction databases, the JCPDS Powder Diffraction File and NBS CRYSTAL DATA, and incorporates 2 years of experience with an earlier version. It contains 71,142 entries, with space group and unit cell data for 59,612 of those. Unit cell and space group information were used, where available, to calculate patterns consisting of all allowed reflections with d -spacings greater than 0.8 A for ~ 59,000 of the entries. Calculated patterns are used in the database in preference to experimental x-ray data when both are available, since experimental x-ray data sometimes omits high d -spacing data which falls at low diffraction angles. Intensity data are not given when calculated spacings are used. A search scheme using chemistry and r -spacing (reciprocal d -spacing) has been developed. Other potentially searchable data in this new database include space group, Pearson symbol, unit cell edge lengths, reduced cell edge length, and reduced cell volume. Compound and/or mineral names, formulas, and journal references are included in the output, as well as pointers to corresponding entries in NBS CRYSTAL DATA and the Powder Diffraction File where more complete information may be obtained. Atom positions are not given. Rudimentary search software has been written to implement a chemistry and r -spacing bit map search. With typical data, a full search through ~ 71,000 compounds takes 10~20 seconds on a PDP 11/23-RL02 system.

Development of splitting convergent beam electron diffraction (SCBED)

Energy Technology Data Exchange (ETDEWEB)

Houdellier, Florent, E-mail: Florent.Houdellier@cemes.fr [CEMES-CNRS, 29 Rue Jeanne Marvig, 31055 Toulouse (France); Röder, Falk [CEMES-CNRS, 29 Rue Jeanne Marvig, 31055 Toulouse (France); Triebenberg Lab, Institut für Strukturphysik, Technische Universität Dresden, D-01062 Dresden (Germany); Snoeck, Etienne [CEMES-CNRS, 29 Rue Jeanne Marvig, 31055 Toulouse (France)

2015-12-15

Using a combination of condenser electrostatic biprism with dedicated electron optic conditions for sample illumination, we were able to split a convergent beam electron probe focused on the sample in two half focused probes without introducing any tilt between them. As a consequence, a combined convergent beam electron diffraction pattern is obtained in the back focal plane of the objective lens arising from two different sample areas, which could be analyzed in a single pattern. This splitting convergent beam electron diffraction (SCBED) pattern has been tested first on a well-characterized test sample of Si/SiGe multilayers epitaxially grown on a Si substrate. The SCBED pattern contains information from the strained area, which exhibits HOLZ lines broadening induced by surface relaxation, with fine HOLZ lines observed in the unstrained reference part of the sample. These patterns have been analyzed quantitatively using both parts of the SCBED transmitted disk. The fine HOLZ line positions are used to determine the precise acceleration voltage of the microscope while the perturbed HOLZ rocking curves in the stained area are compared to dynamical simulated ones. The combination of these two information leads to a precise evaluation of the sample strain state. Finally, several SCBED setups are proposed to tackle fundamental physics questions as well as applied materials science ones and demonstrate how SCBED has the potential to greatly expand the range of applications of electron diffraction and electron holography. - Highlights: • Using a condenser biprism, we split the CBED pattern in two half-CBED disks. • We have determined the electron optical conditions used to perform various SCBED. • We propose new applications possible for this new SCBED configuration.

Contrast of Backscattered Electron SEM Images of Nanoparticles on Substrates with Complex Structure.

Science.gov (United States)

Kowoll, Thomas; Müller, Erich; Fritsch-Decker, Susanne; Hettler, Simon; Störmer, Heike; Weiss, Carsten; Gerthsen, Dagmar

2017-01-01

This study is concerned with backscattered electron scanning electron microscopy (BSE SEM) contrast of complex nanoscaled samples which consist of SiO 2 nanoparticles (NPs) deposited on indium-tin-oxide covered bulk SiO 2 and glassy carbon substrates. BSE SEM contrast of NPs is studied as function of the primary electron energy and working distance. Contrast inversions are observed which prevent intuitive interpretation of NP contrast in terms of material contrast. Experimental data is quantitatively compared with Monte-Carlo- (MC-) simulations. Quantitative agreement between experimental data and MC-simulations is obtained if the transmission characteristics of the annular semiconductor detector are taken into account. MC-simulations facilitate the understanding of NP contrast inversions and are helpful to derive conditions for optimum material and topography contrast.

Experimental observations of electron-backscatter effects from high-atomic-number anodes in large-aspect-ratio, electron-beam diodes

Energy Technology Data Exchange (ETDEWEB)

Cooperstein, G; Mosher, D; Stephanakis, S J; Weber, B V; Young, F C [Naval Research Laboratory, Washington, DC (United States); Swanekamp, S B [JAYCOR, Vienna, VA (United States)

1997-12-31

Backscattered electrons from anodes with high-atomic-number substrates cause early-time anode-plasma formation from the surface layer leading to faster, more intense electron beam pinching, and lower diode impedance. A simple derivation of Child-Langmuir current from a thin hollow cathode shows the same dependence on the diode aspect ratio as critical current. Using this fact, it is shown that the diode voltage and current follow relativistic Child-Langmuir theory until the anode plasma is formed, and then follows critical current after the beam pinches. With thin hollow cathodes, electron beam pinching can be suppressed at low voltages (< 800 kV) even for high currents and high-atomic-number anodes. Electron beam pinching can also be suppressed at high voltages for low-atomic-number anodes as long as the electron current densities remain below the plasma turn-on threshold. (author). 8 figs., 2 refs.

Low temperature electron microscopy and electron diffraction of the purple membrane of Halobacterium halobium

International Nuclear Information System (INIS)

Hayward, S.B.

1978-09-01

The structure of the purple membrane of Halobacterium halobium was studied by high resolution electron microscopy and electron diffraction, primarily at low temperature. The handedness of the purple membrane diffraction pattern with respect to the cell membrane was determined by electron diffraction of purple membranes adsorbed to polylysine. A new method of preparing frozen specimens was used to preserve the high resolution order of the membranes in the electron microscope. High resolution imaging of glucose-embedded purple membranes at room temperature was used to relate the orientation of the diffraction pattern to the absolute orientation of the structure of the bacteriorhodopsin molecule. The purple membrane's critical dose for electron beam-induced damage was measured at room temperature and at -120 0 C, and was found to be approximately five times greater at -120 0 C. Because of this decrease in radiation sensitivity, imaging of the membrane at low temperature should result in an increased signal-to-noise ratio, and thus better statistical definition of the phases of weak reflections. Higher resolution phases may thus be extracted from images than can be determined by imaging at room temperature. To achieve this end, a high resolution, liquid nitrogen-cooled stage was built for the JEOL-100B. Once the appropriate technology for taking low dose images at very high resolution has been developed, this stage will hopefully be used to determine the high resolution structure of the purple membrane

A three-dimensional, two-way, parabolic equation model for acoustic backscattering in a cylindrical coordinate system

DEFF Research Database (Denmark)

Zhu, Dong; Jensen, Leif Bjørnø

2000-01-01

. The major drawback of using the cylindrical coordinate system, when the backscattering solution is valid within a limited area, is analyzed using a geometrical-optical interpretation. The model may be useful for studying three-dimensional backscattering phenomena comprising azimuthal diffraction effects...

Contrast of Backscattered Electron SEM Images of Nanoparticles on Substrates with Complex Structure

Directory of Open Access Journals (Sweden)

Thomas Kowoll

2017-01-01

Full Text Available This study is concerned with backscattered electron scanning electron microscopy (BSE SEM contrast of complex nanoscaled samples which consist of SiO2 nanoparticles (NPs deposited on indium-tin-oxide covered bulk SiO2 and glassy carbon substrates. BSE SEM contrast of NPs is studied as function of the primary electron energy and working distance. Contrast inversions are observed which prevent intuitive interpretation of NP contrast in terms of material contrast. Experimental data is quantitatively compared with Monte-Carlo- (MC- simulations. Quantitative agreement between experimental data and MC-simulations is obtained if the transmission characteristics of the annular semiconductor detector are taken into account. MC-simulations facilitate the understanding of NP contrast inversions and are helpful to derive conditions for optimum material and topography contrast.

Direct detection of near-surface faults by migration of back-scattered surface waves

KAUST Repository

Yu, Han

2014-08-05

We show that diffraction stack migration can be used to estimate the distribution of near-surface faults. The assumption is that near-surface faults generate detectable back-scattered surface waves from impinging surface waves. The processing steps are to isolate the back-scattered surface waves, and then migrate them by diffraction migration using the surface wave velocity as the migration velocity. Instead of summing events along trial quasi-hyperbolas, surface wave migration sums events along trial quasi-linear trajectories that correspond to the moveout of back-scattered surface waves. A deconvolution filter derived from the data can be used to collapse a dispersive arrival into a non-dispersive event. Results with synthetic data and field records validate the feasibility of this method. Applying this method to USArray data or passively recorded exploration data might open new opportunities in mapping tectonic features over the extent of the array.

Electron diffraction patterns with thermal diffuse scattering maxima around Kikuchi lines

International Nuclear Information System (INIS)

Karakhanyan, R. K.; Karakhanyan, K. R.

2011-01-01

Transmission electron diffraction patterns of silicon with thermal diffuse maxima around Kikuchi lines, which are analogs of the maxima of thermal diffuse electron scattering around point reflections, have been recorded. Diffuse maxima are observed only around Kikuchi lines with indices that are forbidden for the silicon structure. The diffraction conditions for forming these maxima are discussed.

The use of combined three-dimensional electron backscatter diffraction and energy dispersive X-ray analysis to assess the characteristics of the gamma/gamma-prime microstructure in alloy 720Li Trade-Mark-Sign

Energy Technology Data Exchange (ETDEWEB)

Child, D.J., E-mail: d.child@lboro.ac.uk [Department of Materials, Loughborough University, Loughborough, Leicestershire, LE11 3TU (United Kingdom); West, G.D., E-mail: g.west@lboro.ac.uk [Department of Materials, Loughborough University, Loughborough, Leicestershire, LE11 3TU (United Kingdom); Thomson, R.C., E-mail: r.c.thomson@lboro.ac.uk [Department of Materials, Loughborough University, Loughborough, Leicestershire, LE11 3TU (United Kingdom)

2012-03-15

Multiple three-dimensional reconstructions of a {gamma}/{gamma} Prime phase structure in Alloy 720Li have been carried out by employing a serial milling technique with simultaneous electron backscatter diffraction (EBSD) and energy dispersive x-ray (EDX) analysis data collection. Combining EBSD data with EDX is critical in obtaining maps to distinguish between the chemically differing, but crystallographically similar {gamma} and {gamma} Prime phases present in the alloy studied. EDX is shown to allow the differentiation of {gamma} and {gamma} Prime phases, with EBSD providing increased grain shape accuracy. The combination of data sources also allowed identification of coherent {gamma}/{gamma} Prime phase interfaces that would not be identified using solely EBSD or EDX. The study identifies a region of grain banding within the alloy, which provides the basis for a three-dimensional comparison and discussion of {gamma} Prime phase size between coarse and fine grain regions, whilst also identifying coherent {gamma} Prime phase interfaces, possible only using both EDX and EBSD systems simultaneously. The majority of the {gamma} Prime phase lies in the range of 1-10 {mu}m in non-banded regions, with a detectable particle size limit of 500 nm being established. The validity of the reconstruction has been demonstrated using an electron interaction volumes model, and an assessment of the validity of EBSD and EDX data sources is discussed showing {gamma} Prime phase connectivity in all dimensions. -- Highlights: Black-Right-Pointing-Pointer Use of combined EBSD/EDX for the 3D analysis of gamma prime in a Ni-based alloy. Black-Right-Pointing-Pointer Assessment of 3D reconstruction accuracy using CASINO. Black-Right-Pointing-Pointer Observation and validation of gamma prime phase connectivity throughout the alloy. Black-Right-Pointing-Pointer Identification and characterisation of grain banding in gamma prime. Black-Right-Pointing-Pointer Distinction of phase coherency

Effect of the cortex on ultrasonic backscatter measurements of cancellous bone

International Nuclear Information System (INIS)

Hoffmeister, Brent K; Holt, Andrew P; Kaste, Sue C

2011-01-01

Ultrasonic backscatter techniques offer a promising new approach for detecting changes in bone caused by osteoporosis. However, several challenges impede clinical implementation of backscatter techniques. This study examines how the dense outer surface of bone (the cortex) affects backscatter measurements of interior regions of porous (cancellous) bone tissue. Fifty-two specimens of bone were prepared from 13 human femoral heads so that the same region of cancellous bone could be ultrasonically interrogated through the cortex or along directions that avoided the cortex. Backscatter signals were analyzed over a frequency range of 0.8-3.0 MHz to determine two ultrasonic parameters: apparent integrated backscatter (AIB) and frequency slope of apparent backscatter (FSAB). The term 'apparent' means that the parameters are sensitive to the frequency-dependent effects of diffraction and attenuation. Significant (p < 0.001) changes in AIB and FSAB indicated that measurements through the cortex decreased the apparent backscattered power and increased the frequency dependence of the power. However, the cortex did not affect the correlation of AIB and FSAB with the x-ray bone mineral density of the specimens. This suggests that results from many previous in vitro backscatter studies of specimens of purely cancellous bone may be extrapolated with greater confidence to in vivo conditions.

Effect of the cortex on ultrasonic backscatter measurements of cancellous bone

Energy Technology Data Exchange (ETDEWEB)

Hoffmeister, Brent K; Holt, Andrew P [Department of Physics, Rhodes College, Memphis, TN (United States); Kaste, Sue C, E-mail: hoffmeister@rhodes.edu [Department of Diagnostic Imaging, St Jude Children' s Research Hospital, Memphis, TN (United States)

2011-10-07

Ultrasonic backscatter techniques offer a promising new approach for detecting changes in bone caused by osteoporosis. However, several challenges impede clinical implementation of backscatter techniques. This study examines how the dense outer surface of bone (the cortex) affects backscatter measurements of interior regions of porous (cancellous) bone tissue. Fifty-two specimens of bone were prepared from 13 human femoral heads so that the same region of cancellous bone could be ultrasonically interrogated through the cortex or along directions that avoided the cortex. Backscatter signals were analyzed over a frequency range of 0.8-3.0 MHz to determine two ultrasonic parameters: apparent integrated backscatter (AIB) and frequency slope of apparent backscatter (FSAB). The term 'apparent' means that the parameters are sensitive to the frequency-dependent effects of diffraction and attenuation. Significant (p < 0.001) changes in AIB and FSAB indicated that measurements through the cortex decreased the apparent backscattered power and increased the frequency dependence of the power. However, the cortex did not affect the correlation of AIB and FSAB with the x-ray bone mineral density of the specimens. This suggests that results from many previous in vitro backscatter studies of specimens of purely cancellous bone may be extrapolated with greater confidence to in vivo conditions.

Low-energy electron diffraction and induced damage in hydrated DNA

International Nuclear Information System (INIS)

Orlando, Thomas M.; Oh, Doogie; Chen Yanfeng; Aleksandrov, Alexandr B.

2008-01-01

Elastic scattering of 5-30 eV electrons within the B-DNA 5 ' -CCGGCGCCGG-3 ' and A-DNA 5 ' -CGCGAATTCGCG-3 ' DNA sequences is calculated using the separable representation of a free-space electron propagator and a curved wave multiple scattering formalism. The disorder brought about by the surrounding water and helical base stacking leads to a featureless amplitude buildup of elastically scattered electrons on the sugar and phosphate groups for all energies between 5 and 30 eV. However, some constructive interference features arising from diffraction are revealed when examining the structural waters within the major groove. These appear at 5-10, 12-18, and 22-28 eV for the B-DNA target and at 7-11, 12-18, and 18-25 eV for the A-DNA target. Although the diffraction depends on the base-pair sequence, the energy dependent elastic scattering features are primarily associated with the structural water molecules localized within 8-10 A spheres surrounding the bases and/or the sugar-phosphate backbone. The electron density buildup occurs in energy regimes associated with dissociative electron attachment resonances, direct electronic excitation, and dissociative ionization. Since diffraction intensity can be localized on structural water, compound H 2 O:DNA states may contribute to energy dependent low-energy electron induced single and double strand breaks

Development and characterization of electron sources for diffraction applications

International Nuclear Information System (INIS)

Casandruc, Albert

2015-12-01

The dream to control chemical reactions that are essential to life is now closer than ever to gratify. Recent scientific progress has made it possible to investigate phenomena and processes which deploy at the angstroms scale and at rates on the order femtoseconds. Techniques such as Ultrafast Electron Diffraction (UED) are currently able to reveal the spatial atomic configuration of systems with unit cell sizes on the order of a few nanometers with about 100 femtosecond temporal resolution. Still, major advances are needed for structural interrogation of biological systems like protein crystals, which have unit cell sizes of 10 nanometers or larger, and sample sizes of less than one micrometer. For such samples, the performance of these electron-based techniques is now limited by the quality, in particular the brightness, of the electron source. The current Ph.D. work represents a contribution towards the development and the characterization of electron sources which are essential to static and time-resolved electron diffraction techniques. The focus was on electron source fabrication and electron beam characterization measurements, using the solenoid and the aperture scan techniques, but also on the development and maintenance of the relevant experimental setups. As a result, new experimental facilities are now available in the group and, at the same time, novel concepts for generating electron beams for electron diffraction applications have been developed. In terms of existing electron sources, the capability to trigger and detect field emission from single double-gated field emitter Mo tips was successfully proven. These sharp emitter tips promise high brightness electron beams, but for investigating individual such structures, new engineering was needed. Secondly, the influence of the surface electric field on electron beam properties has been systematically performed for flat Mo photocathodes. This study is very valuable especially for state

Development and characterization of electron sources for diffraction applications

Energy Technology Data Exchange (ETDEWEB)

Casandruc, Albert

2015-12-15

The dream to control chemical reactions that are essential to life is now closer than ever to gratify. Recent scientific progress has made it possible to investigate phenomena and processes which deploy at the angstroms scale and at rates on the order femtoseconds. Techniques such as Ultrafast Electron Diffraction (UED) are currently able to reveal the spatial atomic configuration of systems with unit cell sizes on the order of a few nanometers with about 100 femtosecond temporal resolution. Still, major advances are needed for structural interrogation of biological systems like protein crystals, which have unit cell sizes of 10 nanometers or larger, and sample sizes of less than one micrometer. For such samples, the performance of these electron-based techniques is now limited by the quality, in particular the brightness, of the electron source. The current Ph.D. work represents a contribution towards the development and the characterization of electron sources which are essential to static and time-resolved electron diffraction techniques. The focus was on electron source fabrication and electron beam characterization measurements, using the solenoid and the aperture scan techniques, but also on the development and maintenance of the relevant experimental setups. As a result, new experimental facilities are now available in the group and, at the same time, novel concepts for generating electron beams for electron diffraction applications have been developed. In terms of existing electron sources, the capability to trigger and detect field emission from single double-gated field emitter Mo tips was successfully proven. These sharp emitter tips promise high brightness electron beams, but for investigating individual such structures, new engineering was needed. Secondly, the influence of the surface electric field on electron beam properties has been systematically performed for flat Mo photocathodes. This study is very valuable especially for state

Compton backscattered collmated X-ray source

Science.gov (United States)

Ruth, Ronald D.; Huang, Zhirong

2000-01-01

A high-intensity, inexpensive and collimated x-ray source for applications such as x-ray lithography is disclosed. An intense pulse from a high power laser, stored in a high-finesse resonator, repetitively collides nearly head-on with and Compton backscatters off a bunched electron beam, having relatively low energy and circulating in a compact storage ring. Both the laser and the electron beams are tightly focused and matched at the interaction region inside the optical resonator. The laser-electron interaction not only gives rise to x-rays at the desired wavelength, but also cools and stabilizes the electrons against intrabeam scattering and Coulomb repulsion with each other in the storage ring. This cooling provides a compact, intense bunch of electrons suitable for many applications. In particular, a sufficient amount of x-rays can be generated by this device to make it an excellent and flexible Compton backscattered x-ray (CBX) source for high throughput x-ray lithography and many other applications.

Compton backscattered collimated x-ray source

Science.gov (United States)

Ruth, R.D.; Huang, Z.

1998-10-20

A high-intensity, inexpensive and collimated x-ray source is disclosed for applications such as x-ray lithography is disclosed. An intense pulse from a high power laser, stored in a high-finesse resonator, repetitively collides nearly head-on with and Compton backscatters off a bunched electron beam, having relatively low energy and circulating in a compact storage ring. Both the laser and the electron beams are tightly focused and matched at the interaction region inside the optical resonator. The laser-electron interaction not only gives rise to x-rays at the desired wavelength, but also cools and stabilizes the electrons against intrabeam scattering and Coulomb repulsion with each other in the storage ring. This cooling provides a compact, intense bunch of electrons suitable for many applications. In particular, a sufficient amount of x-rays can be generated by this device to make it an excellent and flexible Compton backscattered x-ray (CBX) source for high throughput x-ray lithography and many other applications. 4 figs.

Analytic model of electron pulse propagation in ultrafast electron diffraction experiments

International Nuclear Information System (INIS)

Michalik, A.M.; Sipe, J.E.

2006-01-01

We present a mean-field analytic model to study the propagation of electron pulses used in ultrafast electron diffraction experiments (UED). We assume a Gaussian form to characterize the electron pulse, and derive a system of ordinary differential equations that are solved quickly and easily to give the pulse dynamics. We compare our model to an N-body numerical simulation and are able to show excellent agreement between the two result sets. This model is a convenient alternative to time consuming and computationally intense N-body simulations in exploring the dynamics of UED electron pulses, and as a tool for refining UED experimental designs

Time evolution analysis of the electron distribution in Thomson/Compton back-scattering

International Nuclear Information System (INIS)

Petrillo, V.; Bacci, A.; Curatolo, C.; Maroli, C.; Serafini, L.; Rossi, A. R.

2013-01-01

We present the time evolution of the energy distribution of a relativistic electron beam after the Compton back-scattering with a counter-propagating laser field, performed in the framework of the Quantum Electrodynamics, by means of the code CAIN. As the correct angular distribution of the spontaneous emission is accounted, the main effect is the formation of few stripes, followed by the diffusion of the more energetic particles toward lower values in the longitudinal phase space. The Chapman-Kolmogorov master equation gives results in striking agreement with the numerical ones. An experiment on the Thomson source at SPARC-LAB is proposed

Electron and ion currents relevant to accurate current integration in MeV ion backscattering spectrometry

International Nuclear Information System (INIS)

Matteson, S.; Nicolet, M.A.

1979-01-01

The magnitude and characteristics of the currents which flow in the target and the chamber of an MeV ion backscattering spectrometer are examined. Measured energy distributions and the magnitude of high-energy secondary electron currents are reported. An empirical universal curve is shown to fit the energy distribution of secondary electrons for several combinations of ion energy, targets and ion species. The magnitude of tertiary electron currents which arise at the vacuum vessel walls is determined for various experimental situations and is shown to be non-negligible in many cases. An experimental arrangement is described which permits charge integrations to 1% arruracy without restricting access to the target as a Faraday cage does. (Auth.)

Electron diffraction using ultrafast electron bunches from a laser-wakefield accelerator at kHz repetition rate

Science.gov (United States)

He, Z.-H.; Thomas, A. G. R.; Beaurepaire, B.; Nees, J. A.; Hou, B.; Malka, V.; Krushelnick, K.; Faure, J.

2013-02-01

We show that electron bunches in the 50-100 keV range can be produced from a laser wakefield accelerator using 10 mJ, 35 fs laser pulses operating at 0.5 kHz. It is shown that using a solenoid magnetic lens, the electron bunch distribution can be shaped. The resulting transverse and longitudinal coherence is suitable for producing diffraction images from a polycrystalline 10 nm aluminum foil. The high repetition rate, the stability of the electron source, and the fact that its uncorrelated bunch duration is below 100 fs make this approach promising for the development of sub-100 fs ultrafast electron diffraction experiments.

Electron diffraction using ultrafast electron bunches from a laser-wakefield accelerator at kHz repetition rate

Energy Technology Data Exchange (ETDEWEB)

He, Z.-H.; Thomas, A. G. R.; Nees, J. A.; Hou, B.; Krushelnick, K. [Center for Ultrafast Optical Science, University of Michigan, Ann Arbor, Michigan 48106-2099 (United States); Beaurepaire, B.; Malka, V.; Faure, J. [Laboratoire d' Optique Appliquee, ENSTA-CNRS-Ecole Polytechnique, UMR 7639, 91761 Palaiseau (France)

2013-02-11

We show that electron bunches in the 50-100 keV range can be produced from a laser wakefield accelerator using 10 mJ, 35 fs laser pulses operating at 0.5 kHz. It is shown that using a solenoid magnetic lens, the electron bunch distribution can be shaped. The resulting transverse and longitudinal coherence is suitable for producing diffraction images from a polycrystalline 10 nm aluminum foil. The high repetition rate, the stability of the electron source, and the fact that its uncorrelated bunch duration is below 100 fs make this approach promising for the development of sub-100 fs ultrafast electron diffraction experiments.

Mega-electron-volt ultrafast electron diffraction at SLAC National Accelerator Laboratory

Energy Technology Data Exchange (ETDEWEB)

Weathersby, S. P.; Brown, G.; Chase, T. F.; Coffee, R.; Corbett, J.; Eichner, J. P.; Frisch, J. C.; Fry, A. R.; Gühr, M.; Hartmann, N.; Hast, C.; Hettel, R.; Jobe, R. K.; Jongewaard, E. N.; Lewandowski, J. R.; Li, R. K., E-mail: lrk@slac.stanford.edu; Lindenberg, A. M.; Makasyuk, I.; May, J. E.; McCormick, D. [SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, California 94025 (United States); and others

2015-07-15

Ultrafast electron probes are powerful tools, complementary to x-ray free-electron lasers, used to study structural dynamics in material, chemical, and biological sciences. High brightness, relativistic electron beams with femtosecond pulse duration can resolve details of the dynamic processes on atomic time and length scales. SLAC National Accelerator Laboratory recently launched the Ultrafast Electron Diffraction (UED) and microscopy Initiative aiming at developing the next generation ultrafast electron scattering instruments. As the first stage of the Initiative, a mega-electron-volt (MeV) UED system has been constructed and commissioned to serve ultrafast science experiments and instrumentation development. The system operates at 120-Hz repetition rate with outstanding performance. In this paper, we report on the SLAC MeV UED system and its performance, including the reciprocal space resolution, temporal resolution, and machine stability.

Electron diffraction study of {alpha}-AlMnSi crystals including non-crystallographic axes

Energy Technology Data Exchange (ETDEWEB)

Song, G.L.; Bursill, L.A.

1997-06-01

The structure of crystalline {alpha}-AlMnSi is examined by electron diffraction. Six distinct zone axes are examined, including both normal crystallographic and non-crystallographic zones axes, allowing the space group symmetry to be studied. Electron diffraction patterns characteristic of Pm3-bar were obtained for thicker specimens. However, for very thin specimens, as used for HRTEM imaging, the electron diffraction patterns were characteristic of Im3-bar space group symmetry. The structural basis of the Pm3-bar to Im3-bar transformation may be understood in terms of an analysis of the icosahedral structural elements located at the corners and body-centers of the cubic unit cell. A method for indexing the non-crystallographic zone axis diffraction patterns is described. An electron diffraction pattern of the 5-fold axis of the quasicrystalline phase i-AlMnSi is also included; this is compared with the experimental results and calculations for the [0{tau}1] axis of Pm3-bar and Im3-bar crystalline phases. 26 refs., 4 tabs., 7 figs.

Effect of different electron elastic-scattering cross sections on inelastic mean free paths obtained from elastic-backscattering experiments

International Nuclear Information System (INIS)

Jablonskiz, A.; Salvatz, F.; Powellz, C.J.

2004-01-01

Inelastic mean free paths (IMFPs) of electrons with energies between 100 eV and 5,000 eV have been frequently obtained from measurements of elastic-backscattering probabilities for different specimen materials. A calculation of these probabilities is also required to determine IMFPs. We report calculations of elastic-backscattering probabilities for gold at energies of 100 eV and 500 eV with differential elastic-scattering cross sections obtained from the Thomas-Fermi-Dirac potential and the more reliable Dirac-Hartree-Fock potential. For two representative experimental configurations, the average deviation between IMFPs obtained with cross sections from the two potentials was 11.4 %. (author)

Physical methods for studying minerals and solid materials: X-ray, electron and neutron diffraction; scanning and transmission electron microscopy; X-ray, electron and ion spectrometry

International Nuclear Information System (INIS)

Eberhart, J.-P.

1976-01-01

The following topics are discussed: theoretical aspects of radiation-matter interactions; production and measurement of radiations (X rays, electrons, neutrons); applications of radiation interactions to the study of crystalline materials. The following techniques are presented: X-ray and neutron diffraction, electron microscopy, electron diffraction, X-ray fluorescence analysis, electron probe microanalysis, surface analysis by electron emission spectrometry (ESCA and Auger electrons), scanning electron microscopy, secondary ion emission analysis [fr

Size effect in X-ray and electron diffraction patterns from hydroxyapatite particles

International Nuclear Information System (INIS)

Suvorova, E.I.; Buffat, P.-A.

2001-01-01

High-resolution transmission electron microscopy (HRTEM), electron microdiffraction, and X-ray diffraction were used to study hydroxyapatite specimens with particle sizes from a few nanometers to several hundreds of nanometers. Diffuse scattering (without clear reflections in transmission diffraction patterns) or strongly broadened peaks in X-ray diffraction patterns are characteristic for agglomerated hydroxyapatite nanocrystals. However, HRTEM and microdiffraction showed that this cannot be considered as an indication of the amorphous state of the matter but rather as the demonstration of size effect and the morphological and structural features of hydroxyapatite nanocrystals

Ultrashort and coherent single-electron pulses for diffraction at ultimate resolutions

International Nuclear Information System (INIS)

Kirchner, Friedrich Oscar

2013-01-01

Ultrafast electron diffraction is a powerful tool for studying structural dynamics with femtosecond temporal and sub-aangstroem spatial resolutions. It benefits from the high scattering cross-sections of electrons compared X-rays and allows the examination of thin samples, surfaces and gases. One of the main challenges in ultrafast electron diffraction is the generation of electron pulses with a short duration and a large transverse coherence. The former limits the temporal resolution of the experiment while the latter determines the maximum size of the scattering structures that can be studied. In this work, we strive to push the limits of electron diffraction towards higher temporal and spatial resolutions. The decisive step in our approach is to eliminate all detrimental effects caused by Coulomb repulsion between the electrons by reducing the number of electrons per pulse to one. In this situation, the electrons' longitudinal and transverse velocity distributions are determined solely by the photoemission process. By reducing the electron source size on the photocathode, we make use of the small transverse velocity spread to produce electron pulses with a transverse coherence length of 20 nm, which is about an order of magnitude larger than the reported values for comparable experiments. The energy distribution of an ensemble of single-electron pulses from a photoemission source is directly linked to the mismatch between the photon energy and the cathode's work function. This excess energy can be reduced by using a photon energy close to the material's work function. Using a tunable source of ultraviolet pulses, we demonstrate the reduction of the velocity spread of the electrons, resulting in a shorter duration of the electron pulses. The reduced electron pulse durations achieved by a tunable excitation or by other approaches require new characterization techniques for electron pulses. We developed a novel method for the characterization of electron pulses at

Backscattered electron emission after proton impact on carbon and gold films: Experiments and simulations

Energy Technology Data Exchange (ETDEWEB)

Hespeels, F.; Heuskin, A.C. [University of Namur, PMR, 61 rue de Bruxelles, B-5000 Namur (Belgium); Scifoni, E. [TIFPA-INFN, Trento Institute for Fundamental Physics and Applications, Via Sommarive 14, I-38123 Trento (Italy); GSI-Helmholtzzentrum für Schwerionenforschung, Biophysik, Max Planck-Strasse 1, D-64291 Darmstadt (Germany); Kraemer, M. [GSI-Helmholtzzentrum für Schwerionenforschung, Biophysik, Max Planck-Strasse 1, D-64291 Darmstadt (Germany); Lucas, S., E-mail: stephane.lucas@unamur.be [University of Namur, PMR, 61 rue de Bruxelles, B-5000 Namur (Belgium)

2017-06-15

This work aims at measuring the proton induced secondary electron energy spectra from nanometer thin films. Backscattered electron energy spectra were measured within an energy range from 0 to 600 eV using a Retarding Field Analyser (RFA). This paper presents energy spectra obtained for proton (0.5 MeV; 1 MeV; 1.5 MeV; 2 MeV) irradiation of thin carbon films (50 and 100 nm thick) and thin gold film (200 nm). These experimental spectra were compared with Monte Carlo simulations based on TRAX code and Geant4 simulation toolkit. Good agreement between experimental, TRAX and Geant4 results were observed for the carbon target. For the gold target, we report major differences between both Monte Carlo environments. Limitation of Geant4 models for low energy electron emission was highlighted. On the contrary, TRAX simulations present encouraging results for the modeling of low-energy electron emission from gold target.

Monte Carlo simulation of electron depth distribution and backscattering for carbon films deposited on aluminium as a function of incidence angle and primary energy

Science.gov (United States)

Dapor, Maurizio

2005-01-01

Carbon films are deposited on various substrates (polymers, polyester fabrics, polyester yarns, metal alloys) both for experimental and technological motivations (medical devices, biocompatible coatings, food package and so on). Computational studies of the penetration of electron beams in supported thin film of carbon are very useful in order to compare the simulated results with analytical techniques data (obtained by scanning electron microscopy and/or Auger electron spectroscopy) and investigate the film characteristics. In the present paper, the few keV electron depth distribution and backscattering coefficient for the special case of film of carbon deposited on aluminium are investigated, by a Monte Carlo simulation, as a function of the incidence angle and primary electron energy. The simulated results can be used as a way to evaluate the carbon film thickness by a set of measurements of the backscattering coefficient.

Ultrafast electron diffraction studies of optically excited thin bismuth films

International Nuclear Information System (INIS)

Rajkovic, Ivan

2008-01-01

This thesis contains work on the design and the realization of an experimental setup capable of providing sub-picosecond electron pulses for ultrafast electron diffraction experiments, and performing the study of ultrafast dynamics in bismuth after optical excitation using this setup. (orig.)

Ultrafast electron diffraction studies of optically excited thin bismuth films

Energy Technology Data Exchange (ETDEWEB)

Rajkovic, Ivan

2008-10-21

This thesis contains work on the design and the realization of an experimental setup capable of providing sub-picosecond electron pulses for ultrafast electron diffraction experiments, and performing the study of ultrafast dynamics in bismuth after optical excitation using this setup. (orig.)

Micro-channel plate detector for ultra-fast relativistic electron diffraction

International Nuclear Information System (INIS)

Musumeci, P.; Moody, J.T.; Scoby, C.M.; Gutierrez, M.S.; Bender, H.A.; Hilko, B.; Kruschwitz, C.A.; Wilcox, N.S.

2011-01-01

Using relativistic ultra-short electron beams to obtain single-shot diffraction patterns holds the promise to yield real-time resolution of atomic motion in an easily accessible environment, such as a university laboratory, at a fraction of the cost of fourth-generation X-ray sources. One of the main issues in bringing this technique to full maturity is the development of efficient detector systems to record the diffraction pattern using a few MeV electron beams. Low noise, high spatial resolution, and single-electron detection capability are all characteristics of an ideal detector. In this paper, we compare the performances of a traditional fluorescent phosphor screen with a detection system based on the micro-channel plate (MCP). Since MCPs are typically used with lower energy electron beams, these tests constitute one of the few experimental data points available on the use of these devices with MeV energy beams.

Micro-channel plate detector for ultra-fast relativistic electron diffraction

Energy Technology Data Exchange (ETDEWEB)

Musumeci, P., E-mail: musumeci@physics.ucla.edu [UCLA Department of Physics and Astronomy, 475 Portola Plaza, Los Angeles, CA, 90095-1547 (United States); Moody, J.T.; Scoby, C.M.; Gutierrez, M.S. [UCLA Department of Physics and Astronomy, 475 Portola Plaza, Los Angeles, CA, 90095-1547 (United States); Bender, H.A.; Hilko, B.; Kruschwitz, C.A.; Wilcox, N.S. [National Security Technologies, LLC, Los Alamos Operations, Los Alamos, NM (United States)

2011-05-01

Using relativistic ultra-short electron beams to obtain single-shot diffraction patterns holds the promise to yield real-time resolution of atomic motion in an easily accessible environment, such as a university laboratory, at a fraction of the cost of fourth-generation X-ray sources. One of the main issues in bringing this technique to full maturity is the development of efficient detector systems to record the diffraction pattern using a few MeV electron beams. Low noise, high spatial resolution, and single-electron detection capability are all characteristics of an ideal detector. In this paper, we compare the performances of a traditional fluorescent phosphor screen with a detection system based on the micro-channel plate (MCP). Since MCPs are typically used with lower energy electron beams, these tests constitute one of the few experimental data points available on the use of these devices with MeV energy beams.

Axial channeling in electron diffraction

International Nuclear Information System (INIS)

Ichimiya, A.; Lehmpfuhl, G.

1978-01-01

Kossel patterns from Silicon and Niobium were obtained with a convergent electron beam. An intensity maximum in the direction of the zone axes [001] and [111] of Nb was interpreted as axial channeling. The intensity distribution in Kossel patterns was calculated by means of the Bloch wave picture of the dynamical theory of electron diffraction. Particularly zone axis patterns were calculated for different substance-energy combinations and they were compared with experimental observations. The intensity distribution in the calculated Kossel patterns was very sensitive to the model of absorption and it was found that a treatment of the absorption close to the model of Humphreys and Hirsch [Phil. Mag. 18, 115 (1968)] gave the best agreement with the experimental observations. Furthermore it is shown which Bloch waves are important for the intensity distribution in the Kossel patterns, how they are absorbed and how they change with energy. (orig.) [de

Future of Electron Scattering and Diffraction

Energy Technology Data Exchange (ETDEWEB)

Hall, Ernest [GE Global Research, Niskayuna, New York (United States); Stemmer, Susanne [Univ. of California, Santa Barbara, CA (United States); Zheng, Haimei [Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Zhu, Yimei [Brookhaven National Lab. (BNL), Upton, NY (United States); Maracas, George [Dept. of Energy (DOE), Washington DC (United States). Office of Science

2014-02-25

The ability to correlate the atomic- and nanoscale-structure of condensed matter with physical properties (e.g., mechanical, electrical, catalytic, and optical) and functionality forms the core of many disciplines. Directing and controlling materials at the quantum-, atomic-, and molecular-levels creates enormous challenges and opportunities across a wide spectrum of critical technologies, including those involving the generation and use of energy. The workshop identified next generation electron scattering and diffraction instruments that are uniquely positioned to address these grand challenges. The workshop participants identified four key areas where the next generation of such instrumentation would have major impact: A – Multidimensional Visualization of Real Materials B – Atomic-scale Molecular Processes C – Photonic Control of Emergence in Quantum Materials D – Evolving Interfaces, Nucleation, and Mass Transport Real materials are comprised of complex three-dimensional arrangements of atoms and defects that directly determine their potential for energy applications. Understanding real materials requires new capabilities for three-dimensional atomic scale tomography and spectroscopy of atomic and electronic structures with unprecedented sensitivity, and with simultaneous spatial and energy resolution. Many molecules are able to selectively and efficiently convert sunlight into other forms of energy, like heat and electric current, or store it in altered chemical bonds. Understanding and controlling such process at the atomic scale require unprecedented time resolution. One of the grand challenges in condensed matter physics is to understand, and ultimately control, emergent phenomena in novel quantum materials that necessitate developing a new generation of instruments that probe the interplay among spin, charge, orbital, and lattice degrees of freedom with intrinsic time- and length-scale resolutions. Molecules and soft matter require imaging and

'Ab initio' structure solution from electron diffraction data obtained by a combination of automated diffraction tomography and precession technique

International Nuclear Information System (INIS)

Mugnaioli, E.; Gorelik, T.; Kolb, U.

2009-01-01

Using a combination of our recently developed automated diffraction tomography (ADT) module with precession electron technique (PED), quasi-kinematical 3D diffraction data sets of an inorganic salt (BaSO 4 ) were collected. The lattice cell parameters and their orientation within the data sets were found automatically. The extracted intensities were used for 'ab initio' structure analysis by direct methods. The data set covered almost the complete set of possible symmetrically equivalent reflections for an orthorhombic structure. The structure solution in one step delivered all heavy (Ba, S) as well as light atoms (O). Results of the structure solution using direct methods, charge flipping and maximum entropy algorithms as well as structure refinement for three different 3D electron diffraction data sets were presented.

Studies of deformation-induced texture development in sheet materials using diffraction techniques

International Nuclear Information System (INIS)

Banovic, S.W.; Vaudin, M.D.; Gnaeupel-Herold, T.H.; Saylor, D.M.; Rodbell, K.P

2004-01-01

Crystallographic texture measurements were made on a series of rolled aluminum sheet specimens deformed in equi-biaxial tension up to a strain level of 0.11. The measurement techniques used were neutron diffraction with a 4-circle goniometer, electron backscatter diffraction, conventional powder X-ray diffraction (XRD), and XRD using an area detector. Results indicated a complex texture orientation distribution function which altered in response to the applied plastic deformation. Increased deformation caused the {1 1 0} planes, to align parallel to the plane of the sheet. The different techniques produced results that were very consistent with each other. The advantages and disadvantages of the various methods are discussed, with particular consideration of the time taken for each method, the range of orientation space accessible, the density of data that can be obtained, and the statistical significance of each data set with respect to rolled sheet product

Near-surface fault detection by migrating back-scattered surface waves with and without velocity profiles

KAUST Repository

Yu, Han

2016-04-26

We demonstrate that diffraction stack migration can be used to discover the distribution of near-surface faults. The methodology is based on the assumption that near-surface faults generate detectable back-scattered surface waves from impinging surface waves. We first isolate the back-scattered surface waves by muting or FK filtering, and then migrate them by diffraction migration using the surface wave velocity as the migration velocity. Instead of summing events along trial quasi-hyperbolas, surface wave migration sums events along trial quasi-linear trajectories that correspond to the moveout of back-scattered surface waves. We have also proposed a natural migration method that utilizes the intrinsic traveltime property of the direct and the back-scattered waves at faults. For the synthetic data sets and the land data collected in Aqaba, where surface wave velocity has unexpected perturbations, we migrate the back-scattered surface waves with both predicted velocity profiles and natural Green\\'s function without velocity information. Because the latter approach avoids the need for an accurate velocity model in event summation, both the prestack and stacked migration images show competitive quality. Results with both synthetic data and field records validate the feasibility of this method. We believe applying this method to global or passive seismic data can open new opportunities in unveiling tectonic features.

Ultrafast molecular imaging by laser-induced electron diffraction

International Nuclear Information System (INIS)

Peters, M.; Nguyen-Dang, T. T.; Cornaggia, C.; Saugout, S.; Charron, E.; Keller, A.; Atabek, O.

2011-01-01

We address the feasibility of imaging geometric and orbital structures of a polyatomic molecule on an attosecond time scale using the laser-induced electron diffraction (LIED) technique. We present numerical results for the highest molecular orbitals of the CO 2 molecule excited by a near-infrared few-cycle laser pulse. The molecular geometry (bond lengths) is determined within 3% of accuracy from a diffraction pattern which also reflects the nodal properties of the initial molecular orbital. Robustness of the structure determination is discussed with respect to vibrational and rotational motions with a complete interpretation of the laser-induced mechanisms.

Role of diffraction and electron analysis in the fast reactor programme

Energy Technology Data Exchange (ETDEWEB)

Ferguson, I. F. [ed.

1975-09-15

After first discussing irradiation damage, the whole range of new methods of probe analysis were reviewed with a special reference to the study of surfaces. Further papers discussed scanning auger microscopy and the nuclear microprobe. Current diffraction studies were then described on uranium dioxide and the neutron poisons: boron carbide and europia. Finally, new techniques were covered with special reference to the scanning electron microscope and the application of the Harwell 6000 series electronics to x-ray diffraction. Separate records were prepared for each paper covered.

Evaluation of computational models and cross sections used by MCNP6 for simulation of electron backscattering

Energy Technology Data Exchange (ETDEWEB)

Poškus, Andrius, E-mail: andrius.poskus@ff.vu.lt

2016-02-01

This work evaluates the accuracy of the single-event (SE) and condensed-history (CH) models of electron transport in Monte Carlo simulations of electron backscattering from thick layers of Be, C, Al, Cu, Ag, Au and U at incident electron energies from 200 eV to 15 MeV. The CH method is used in simulations performed with MCNP6.1, and the SE method is used in simulations performed with an open-source single-event code MCNelectron written by the author of this paper. Both MCNP6.1 and MCNelectron use mainly ENDF/B-VI.8 library data, but MCNelectron allows replacing cross sections of certain types of interactions by alternative datasets from other sources. The SE method is evaluated both using only ENDF/B-VI.8 cross sections (the “SE-ENDF/B method”, which is equivalent to using MCNP6.1 in SE mode) and with an alternative set of elastic scattering cross sections obtained from relativistic (Dirac) partial-wave (DPW) calculations (the “SE-DPW method”). It is shown that at energies from 200 eV to 300 keV the estimates of the backscattering coefficients obtained using the SE-DPW method are typically within 10% of the experimental data, which is approximately the same accuracy that is achieved using MCNP6.1 in CH mode. At energies below 1 keV and above 300 keV, the SE-DPW method is much more accurate than the SE-ENDF/B method due to lack of angular distribution data in the ENDF/B library in those energy ranges. At energies from 500 keV to 15 MeV, the CH approximation is roughly twice more accurate than the SE-DPW method, with the average relative errors equal 7% and 14%, respectively. The energy probability density functions (PDFs) of backscattered electrons for Al and Cu, calculated using the SE method with DPW cross sections when energy of incident electrons is 20 keV, have an average absolute error as low as 4% of the average PDF. This error is approximately twice less than the error of the corresponding PDF calculated using the CH approximation. It is concluded

Anisotropy of the apparent frequency dependence of backscatter in formalin fixed human myocardium.

Science.gov (United States)

Hall, C S; Verdonk, E D; Wickline, S A; Perez, J E; Miller, J G

1997-01-01

Measurements of the frequency dependence of ultrasonic backscatter are presented for specific angles of insonification for regions of infarcted and noninfarcted human myocardium. A 5-MHz transducer was used to insonify cylindrical cores taken from 7 noninfarcted regions and 12 infarcted regions of the left ventricular free wall of 6 formalin-fixed human hearts explanted because of ischemic cardiomyopathy. The dependence of apparent (uncompensated for diffraction effects and attenuation) backscatter on frequency was approximated by a power-law dependence, magnitude of B(f)2 = afn. Under ideal conditions in a lossless medium, the effect of not compensating for the effects of diffraction and attenuation leads to the value of n to be 2.0 for Rayleigh scatterers while the frequency dependence of the fully compensated backscatter coefficient would be f4. The value of n was determined over the frequency range, 3-7 MHz. Both nonifarcted and infarcted myocardium exhibited anisotropy of the frequency dependence of backscatter, with maxima occurring at angles that were perpendicular to the predominant myofiber direction and minima when parallel to the fibers. Perpendicular insonification yielded results for n of 1.8 +/- 0.1 for noninfarcted myocardium and 1.2 +/- 0.1 for infarcted myocardium while parallel insonification yielded results of 0.4 +/- 0.1 for noninfarcted and 0.0 +/- 0.1 for infarcted myocardium. The functional form of the angle-dependent backscatter is similar for both noninfarcted and infarcted myocardium, although the frequency dependence is clearly different for both tissue states for all angles of insonification. The results of this study indicate that the anisotropy of the frequency dependence of backscatter may play a significant role in ultrasonic imaging and is an important consideration for ultrasonic tissue characterization in myocardium.

Electronic diffraction tomography by Green's functions and singular values decompositions

International Nuclear Information System (INIS)

Mayer, A.

2001-01-01

An inverse scattering technique is developed to enable a three-dimensional sample reconstruction from the diffraction figures obtained for different sample orientations by electronic projection microscopy, thus performing a diffraction tomography. In its Green's-functions formulation, this technique takes account of all orders of diffraction by performing an iterative reconstruction of the wave function on the observation screen and in the sample. In a final step, these quantities enable a reconstruction of the potential-energy distribution, which is assumed real valued. The method relies on the use of singular values decomposition techniques, thus providing the best least-squares solutions and enabling a reduction of noise. The technique is applied to the analysis of a three-dimensional nanometric sample that is observed in Fresnel conditions with an electron energy of 40 eV. The algorithm turns out to provide results with a mean relative error around 3% and to be stable against random noise

Phase analysis of nano-phase materials using selected area electron diffraction in the TEM

International Nuclear Information System (INIS)

Labar, J. L.

2002-01-01

In analogy to X-ray power diffraction (XRD), we are developing a method to help phase identification when examining a large number of grains simultaneously by electron diffraction. Although XRD is well established, it can not be used for small quantities of materials (volumes below 1 mm 3 ). Examining a usual TEM sample with thickness of 100 nm and using a selected area of 1 mm in diameter, the selected area electron diffraction pattern (SAED) carries information about several thousands of grains from a material with an average grain size of about 10 nm. The accuracy of XRD can not be attained by electron diffraction (ED). However, simultaneous visual observation of the nanostructure is an additional benefit of TEM (beside the small amount of needed material). The first step of the development project was the development of a computer program ('ProcessDiffraction') that processes digital versions of SAED patterns and presents them in an XRD-like form (intensity vs. scattering vector). In the present version (V2.0.3) phase identification is carried out by comparing the measured distribution to 'Markers', i.e. data of known phases. XRD data cards are used if the detailed structure of a phase is not known. Kinematic electron diffraction intensities are calculated for phases with known atomic positions (Author)

A compact Compton backscatter X-ray source for mammography and coronary angiography

International Nuclear Information System (INIS)

Nguyen, D.C.; Kinross-Wright, J.M.; Weber, M.E.; Volz, S.K.; Gierman, S.M.; Hayes, K.; Vernon, W.; Goldstein, D.J.

1998-01-01

This is the final report of a three-year, Laboratory Directed Research and Development (LDRD) project at Los Alamos National Laboratory (LANL). The project objective is to generate a large flux of tunable, monochromatic x-rays for use in mammography and coronary angiography. The approach is based on Compton backscattering of an ultraviolet solid-state laser beam against the high-brightness 20-MeV electron beams from a compact linear accelerator. The direct Compton backscatter approach failed to produce a large flux of x-rays due to the low photon flux of the scattering solid-state laser. The authors have modified the design of a compact x-ray source to the new Compton backscattering geometry with use of a regenerative amplifier free-electron laser. They have successfully demonstrated the production of a large flux of infrared photons and a high-brightness electron beam focused in both dimensions for performing Compton backscattering in a regenerative amplifier geometry

Determination of the analyzing power of the A4 Compton-backscattering polarimeter for the measurement of the longitudinal spin polarization of the MAMI electron beam

International Nuclear Information System (INIS)

Diefenbacher, Juergen

2010-01-01

The A4 experiment determines the strange quark contribution to the electromagnetic from factors of the nucleon by measuring the parity violation in elastic electron nucleon scattering. These measurements are carried out using the spin polarized electron beam of the Mainzer Mikrotron (MAMI) with beam energies in the range from 315 to 1508 MeV. For the data analysis it is essential to determine the degree of polarization of the electron beam in order to extract the physics asymmetry from the measured parity violating asymmetry. For this reason the A4 collaboration has developed a novel type of Compton laser backscattering polarimeter that allows for a non-destructive measurement of the beam polarization in parallel to the running parity experiment. In the scope of this work the polarimeter was refined in order to enable reliable continuous operation of the polarimeter. The data acquisition system for the photon and electron detector was re-designed and optimized to cope with high count rates. A novel detector (LYSO) for the backscattered photons was commissioned. Furthermore, GEANT4 simulations of the detectors have been performed and an analysis environment for the extraction of Compton asymmetries from the backscattered photon data has been developed. The analysis makes use of the possibility to detect backscattered photons in coincidence with the scattered electrons, thus tagging the photons. The tagging introduces a differential energy scale which enables the precise determination of the analyzing power. In this work the analyzing power of the polarimeter has been determined. Therefore, at a beam current of 20 μA the product of electron and laser polarization can be determined, while the parity experiment is running, with a statistical accuracy of 1 % in 24 hours at 855 MeV or 2 =0.6 (GeV/c) 2 the analysis yields a raw asymmetry of A Roh PV =(-20.0±0.9 stat ) x 10 -6 at the moment. For a beam polarization of 80 % the total error would be 1,68 x 10 -6 with ΔP e

Direct detection of near-surface faults by migration of back-scattered surface waves

KAUST Repository

Yu, Han; Guo, Bowen; Hanafy, Sherif; Lin, Fan-Chi; Schuster, Gerard T.

2014-01-01

We show that diffraction stack migration can be used to estimate the distribution of near-surface faults. The assumption is that near-surface faults generate detectable back-scattered surface waves from impinging surface waves. The processing steps

Time-resolved measurements with streaked diffraction patterns from electrons generated in laser plasma wakefield

Science.gov (United States)

He, Zhaohan; Nees, John; Hou, Bixue; Krushelnick, Karl; Thomas, Alec; Beaurepaire, Benoît; Malka, Victor; Faure, Jérôme

2013-10-01

Femtosecond bunches of electrons with relativistic to ultra-relativistic energies can be robustly produced in laser plasma wakefield accelerators (LWFA). Scaling the electron energy down to sub-relativistic and MeV level using a millijoule laser system will make such electron source a promising candidate for ultrafast electron diffraction (UED) applications due to the intrinsic short bunch duration and perfect synchronization with the optical pump. Recent results of electron diffraction from a single crystal gold foil, using LWFA electrons driven by 8-mJ, 35-fs laser pulses at 500 Hz, will be presented. The accelerated electrons were collimated with a solenoid magnetic lens. By applying a small-angle tilt to the magnetic lens, the diffraction pattern can be streaked such that the temporal evolution is separated spatially on the detector screen after propagation. The observable time window and achievable temporal resolution are studied in pump-probe measurements of photo-induced heating on the gold foil.

Application of backscatter electrons for large area imaging of cavities produced by neutron irradiation

Energy Technology Data Exchange (ETDEWEB)

Pastukhov, V.I. [Joint Stock Company “Institute of Nuclear Materials” (JSC “INM”), Zarechny, Sverdlovsk Region (Russian Federation); Ural Federal University Named After the First President of Russia, B. N. Yeltsyn, Ekaterinburg (Russian Federation); National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Moscow (Russian Federation); Averin, S.A.; Panchenko, V.L. [Joint Stock Company “Institute of Nuclear Materials” (JSC “INM”), Zarechny, Sverdlovsk Region (Russian Federation); National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Moscow (Russian Federation); Portnykh, I.A. [Joint Stock Company “Institute of Nuclear Materials” (JSC “INM”), Zarechny, Sverdlovsk Region (Russian Federation); Freyer, P.D. [Westinghouse Electric Company, Pittsburgh, PA (United States); Giannuzzi, L.A. [L.A. Giannuzzi & Associates LLC, Fort Myers, FL (United States); Garner, F.A., E-mail: frank.garner@dslextreme.com [National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Moscow (Russian Federation); Radiation Effects Consulting LLC, Richland, WA (United States); Texas A& M University, College Station, TX (United States)

2016-11-15

It is shown that with proper optimization, backscattered electrons in a scanning electron microscope can produce images of cavity distribution in austenitic steels over a large specimen surface for a depth of ∼500–700 nm, eliminating the need for electropolishing or multiple specimen production. This technique is especially useful for quantifying cavity structures when the specimen is known or suspected to contain very heterogeneous distributions of cavities. Examples are shown for cold-worked EK-164, a very heterogeneously-swelling Russian fast reactor fuel cladding steel and also for AISI 304, a homogeneously-swelling Western steel used for major structural components of light water cooled reactors. This non-destructive overview method of quantifying cavity distribution can be used to direct the location and number of required focused ion beam prepared transmission electron microscopy specimens for examination of either neutron or ion-irradiated specimens. This technique can also be applied in stereo mode to quantify the depth dependence of cavity distributions.

Backscattered electron SEM imaging of resin sections from plant specimens: observation of histological to subcellular structure and CLEM.

Science.gov (United States)

Rizzo, N W; Duncan, K E; Bourett, T M; Howard, R J

2016-08-01

We have refined methods for biological specimen preparation and low-voltage backscattered electron imaging in the scanning electron microscope that allow for observation at continuous magnifications of ca. 130-70 000 X, and documentation of tissue and subcellular ultrastructure detail. The technique, based upon early work by Ogura & Hasegawa (1980), affords use of significantly larger sections from fixed and resin-embedded specimens than is possible with transmission electron microscopy while providing similar data. After microtomy, the sections, typically ca. 750 nm thick, were dried onto the surface of glass or silicon wafer and stained with heavy metals-the use of grids avoided. The glass/wafer support was then mounted onto standard scanning electron microscopy sample stubs, carbon-coated and imaged directly at an accelerating voltage of 5 kV, using either a yttrium aluminum garnet or ExB backscattered electron detector. Alternatively, the sections could be viewed first by light microscopy, for example to document signal from a fluorescent protein, and then by scanning electron microscopy to provide correlative light/electron microscope (CLEM) data. These methods provide unobstructed access to ultrastructure in the spatial context of a section ca. 7 × 10 mm in size, significantly larger than the typical 0.2 × 0.3 mm section used for conventional transmission electron microscopy imaging. Application of this approach was especially useful when the biology of interest was rare or difficult to find, e.g. a particular cell type, developmental stage, large organ, the interface between cells of interacting organisms, when contextual information within a large tissue was obligatory, or combinations of these factors. In addition, the methods were easily adapted for immunolocalizations. © 2015 The Author. Journal of Microscopy published by John Wiley & Sons, Ltd on behalf of the Royal Microscopical Society.

Precession electron diffraction – a topical review

Directory of Open Access Journals (Sweden)

Paul A. Midgley

2015-01-01

Full Text Available In the 20 years since precession electron diffraction (PED was introduced, it has grown from a little-known niche technique to one that is seen as a cornerstone of electron crystallography. It is now used primarily in two ways. The first is to determine crystal structures, to identify lattice parameters and symmetry, and ultimately to solve the atomic structure ab initio. The second is, through connection with the microscope scanning system, to map the local orientation of the specimen to investigate crystal texture, rotation and strain at the nanometre scale. This topical review brings the reader up to date, highlighting recent successes using PED and providing some pointers to the future in terms of method development and how the technique can meet some of the needs of the X-ray crystallography community. Complementary electron techniques are also discussed, together with how a synergy of methods may provide the best approach to electron-based structure analysis.

High current table-top setup for femtosecond gas electron diffraction

Directory of Open Access Journals (Sweden)

Omid Zandi

2017-07-01

Full Text Available We have constructed an experimental setup for gas phase electron diffraction with femtosecond resolution and a high average beam current. While gas electron diffraction has been successful at determining molecular structures, it has been a challenge to reach femtosecond resolution while maintaining sufficient beam current to retrieve structures with high spatial resolution. The main challenges are the Coulomb force that leads to broadening of the electron pulses and the temporal blurring that results from the velocity mismatch between the laser and electron pulses as they traverse the sample. We present here a device that uses pulse compression to overcome the Coulomb broadening and deliver femtosecond electron pulses on a gas target. The velocity mismatch can be compensated using laser pulses with a tilted intensity front to excite the sample. The temporal resolution of the setup was determined with a streak camera to be better than 400 fs for pulses with up to half a million electrons and a kinetic energy of 90 keV. The high charge per pulse, combined with a repetition rate of 5 kHz, results in an average beam current that is between one and two orders of magnitude higher than previously demonstrated.

Detection of electron magnetic circular dichroism signals under zone axial diffraction geometry

Energy Technology Data Exchange (ETDEWEB)

Song, Dongsheng [National Center for Electron Microscopy in Beijing, Key Laboratory of Advanced Materials (MOE) and The State Key Laboratory of New Ceramics and Fine Processing, School of Materials Science and Engineering, Tsinghua University, Beijing 100084 (China); Rusz, Jan [Department of Physics and Astronomy, Uppsala University, Box 516, S-751 20 Uppsala (Sweden); Cai, Jianwang [Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190 (China); Zhu, Jing, E-mail: jzhu@mail.tsinghua.edu.cn [National Center for Electron Microscopy in Beijing, Key Laboratory of Advanced Materials (MOE) and The State Key Laboratory of New Ceramics and Fine Processing, School of Materials Science and Engineering, Tsinghua University, Beijing 100084 (China)

2016-10-15

EMCD (electron magnetic circular dichroism) technique provides us a new opportunity to explore magnetic properties in the transmission electron microscope. However, specific diffraction geometry is the major limitation. Only the two-beam and three-beam case are demonstrated in the experiments until now. Here, we present the more general case of zone axial (ZA) diffraction geometry through which the EMCD signals can be detected even with the very strong sensitivity to dynamical diffraction conditions. Our detailed calculations and well-controlled diffraction conditions lead to experiments in agreement with theory. The effect of dynamical diffraction conditions on EMCD signals are discussed both in theory and experiments. Moreover, with the detailed analysis of dynamical diffraction effects, we experimentally obtain the separate EMCD signals for each crystallographic site in Y{sub 3}Fe{sub 5}O{sub 12}, which is also applicable for other materials and cannot be achieved by site-specific EMCD and XMCD technique directly. Our work extends application of more general diffraction geometries and will further promote the development of EMCD technique. - Highlights: • The zone axial (ZA) diffraction geometry is presented for EMCD technique. • The detailed calculations for EMCD signals under ZA case are conducted. • The EMCD signals are obtained under the ZA case in the experiments. • The effect of dynamical effect on EMCD signals under ZA case is discussed. • Site-specific EMCD signals of Fe in Y{sub 3}Fe{sub 5}O{sub 12} are obtained by specific ZA conditions.

Electron diffraction of CBr{sub 4} in superfluid helium droplets: A step towards single molecule diffraction

Energy Technology Data Exchange (ETDEWEB)

He, Yunteng; Zhang, Jie; Kong, Wei, E-mail: wei.kong@oregonstate.edu [Department of Chemistry, Oregon State University, Corvallis, Oregon 97331-4003 (United States)

2016-07-21

We demonstrate the practicality of electron diffraction of single molecules inside superfluid helium droplets using CBr{sub 4} as a testing case. By reducing the background from pure undoped droplets via multiple doping, with small corrections for dimers and trimers, clearly resolved diffraction rings of CBr{sub 4} similar to those of gas phase molecules can be observed. The experimental data from CBr{sub 4} doped droplets are in agreement with both theoretical calculations and with experimental results of gaseous species. The abundance of monomers and clusters in the droplet beam also qualitatively agrees with the Poisson statistics. Possible extensions of this approach to macromolecular ions will also be discussed. This result marks the first step in building a molecular goniometer using superfluid helium droplet cooling and field induced orientation. The superior cooling effect of helium droplets is ideal for field induced orientation, but the diffraction background from helium is a concern. This work addresses this background issue and identifies a possible solution. Accumulation of diffraction images only becomes meaningful when all images are produced from molecules oriented in the same direction, and hence a molecular goniometer is a crucial technology for serial diffraction of single molecules.

LACDIF, a new electron diffraction technique obtained with the LACBED configuration and a C{sub s} corrector: Comparison with electron precession

Energy Technology Data Exchange (ETDEWEB)

Morniroli, J.P. [Laboratoire de Metallurgie Physique et Genie des Materiaux, UMR CNRS 8517, USTL and ENSCL, Cite Scientifique, 59655 Villeneuve d' Ascq (France)], E-mail: jean-paul.morniroli@univ-lille1.fr; Houdellier, F.; Roucau, C. [CEMES-CNRS, 29 Rue Jeanne Marvig, BP 94347, 31055 Toulouse Cedex 4 (France); Puiggali, J.; Gesti, S. [Departament d' Enginyeria Quimica, Universitat Politecnica de Catalunya, Av. Diagonal 647, 08028 Barcelona (Spain); Redjaimia, A. [Laboratoire de Science et Genie des Surfaces, UMR CNRS 7570, Ecole des Mines de Nancy, Parc de Saurupt 54042 Nancy (France)

2008-01-15

By combining the large-angle convergent-beam electron diffraction (LACBED) configuration together with a microscope equipped with a C{sub s} corrector it is possible to obtain good quality spot patterns in image mode and not in diffraction mode as it is usually the case. These patterns have two main advantages with respect to the conventional selected-area electron diffraction (SAED) or microdiffraction patterns. They display a much larger number of reflections and the diffracted intensity is the integrated intensity. These patterns have strong similarities with the electron precession patterns and they can be used for various applications like the identification of the possible space groups of a crystal from observations of the Laue zones or the ab-initio structure identifications. Since this is a defocused method, another important application concerns the analysis of electron beam-sensitive materials. Successful applications to polymers are given in the present paper to prove the validity of this method with regards to these materials.

Small area analysis using micro-diffraction techniques

International Nuclear Information System (INIS)

Goehner, Raymond P.; Tissot, Ralph G. Jr.; Michael, Joseph R.

2000-01-01

An overall trend toward smaller electronic packages and devices makes it increasingly important and difficult to obtain meaningful diffraction information from small areas. X-ray micro-diffraction, electron back-scattered diffraction (EBSD) and Kossel are micro-diffraction techniques used for crystallographic analysis including texture, phase identification and strain measurements. X-ray micro-diffraction primarily is used for phase analysis and residual strain measurements. X-ray micro-diffraction primarily is used for phase analysis and residual strain measurements of areas between 10 microm to 100 microm. For areas this small glass capillary optics are used for producing a usable collimated x-ray beam. These optics are designed to reflect x-rays below the critical angle therefore allowing for larger solid acceptance angle at the x-ray source resulting in brighter smaller x-ray beams. The determination of residual strain using micro-diffraction techniques is very important to the semiconductor industry. Residual stresses have caused voiding of the interconnect metal which then destroys electrical continuity. Being able to determine the residual stress helps industry to predict failures from the aging effects of interconnects due to this stress voiding. Stress measurements would be impossible using a conventional x-ray diffractometer; however, utilizing a 30 microm glass capillary these small areas are readily assessable for analysis. Kossel produces a wide angle diffraction pattern from fluorescent x-rays generated in the sample by an e-beam in a SEM. This technique can yield very precise lattice parameters for determining strain. Fig. 2 shows a Kossel pattern from a Ni specimen. Phase analysis on small areas is also possible using an energy dispersive spectrometer (EBSD) and x-ray micro-diffraction techniques. EBSD has the advantage of allowing the user to observe the area of interest using the excellent imaging capabilities of the SEM. An EDS detector has been

Diamond Thermal Expansion Measurement Using Transmitted X-ray Back-diffraction.

OpenAIRE

Giles, Carlos; Adriano, Cris; Lubambo, Adriana Freire; Cusatis, Cesar; Mazzaro, Irineu; Hönnicke, Marcelo Goncalves

2015-01-01

The linear thermal expansion coefficient of diamond has been measured using forward-diffracted profiles in X-ray backscattering. This experimental technique is presented as an alternative way of measuring thermal expansion coefficients of solids in the high-resolution Bragg backscattering geometry without the intrinsic difficulty of detecting the reflected beam. The temperature dependence of the lattice parameter is obtained from the high sensitivity of the transmitted profiles to the Bragg a...

Measurements of transient electron density distributions by femtosecond X-ray diffraction

International Nuclear Information System (INIS)

Freyer, Benjamin

2013-01-01

This thesis concerns measurements of transient charge density maps by femtosecond X-ray diffraction. Different X-ray diffraction methods will be considered, particularly with regard to their application in femtosecond X-ray diffraction. The rotation method is commonly used in stationary X-ray diffraction. In the work in hand an X-ray diffraction experiment is demonstrated, which combines the method with ultrafast X-ray pulses. This experiment is the first implementation which makes use of the rotation method to map transient intensities of a multitude of Bragg reflections. As a prototype material Bismuth is used, which previously was studied frequently by femtosecond X-ray diffraction by measuring Bragg reflections successively. The experimental results of the present work are compared with the literature data. In the second part a powder-diffraction experiment will be presented, which is used to study the dynamics of the electron-density distribution on ultrafast time scales. The experiment investigates a transition metal complex after photoexcitation of the metal to ligand charge transfer state. Besides expected results, i. e. the change of the bond length between the metal and the ligand and the transfer of electronic charge from the metal to the ligand, a strong contribution of the anion to the charge transfer was found. Furthermore, the charge transfer has predominantly a cooperative character. That is, the excitation of a single complex causes an alteration of the charge density of several neighboring units. The results show that more than 30 transition-metal complexes and 60 anions contribute to the charge transfer. This collective response is a consequence of the strong coulomb interactions of the densely packed ions.

A Medipix quantum area detector allows rotation electron diffraction data collection from submicrometre three-dimensional protein crystals

International Nuclear Information System (INIS)

Nederlof, Igor; Genderen, Eric van; Li, Yao-Wang; Abrahams, Jan Pieter

2013-01-01

An ultrasensitive Medipix2 detector allowed the collection of rotation electron-diffraction data from single three-dimensional protein nanocrystals for the first time. The data could be analysed using the standard X-ray crystallography programs MOSFLM and SCALA. When protein crystals are submicrometre-sized, X-ray radiation damage precludes conventional diffraction data collection. For crystals that are of the order of 100 nm in size, at best only single-shot diffraction patterns can be collected and rotation data collection has not been possible, irrespective of the diffraction technique used. Here, it is shown that at a very low electron dose (at most 0.1 e − Å −2 ), a Medipix2 quantum area detector is sufficiently sensitive to allow the collection of a 30-frame rotation series of 200 keV electron-diffraction data from a single ∼100 nm thick protein crystal. A highly parallel 200 keV electron beam (λ = 0.025 Å) allowed observation of the curvature of the Ewald sphere at low resolution, indicating a combined mosaic spread/beam divergence of at most 0.4°. This result shows that volumes of crystal with low mosaicity can be pinpointed in electron diffraction. It is also shown that strategies and data-analysis software (MOSFLM and SCALA) from X-ray protein crystallography can be used in principle for analysing electron-diffraction data from three-dimensional nanocrystals of proteins

Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping

Energy Technology Data Exchange (ETDEWEB)

Pekin, Thomas C. [Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, USA 94720 (United States); National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, USA 94720 (United States); Gammer, Christoph [Erich Schmid Institute of Materials Science, Jahnstrasse 12, Leoben, Austria 8700 (Austria); Ciston, Jim [National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, USA 94720 (United States); Minor, Andrew M. [Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, USA 94720 (United States); National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, USA 94720 (United States); Ophus, Colin, E-mail: cophus@gmail.com [National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, USA 94720 (United States)

2017-05-15

Scanning nanobeam electron diffraction strain mapping is a technique by which the positions of diffracted disks sampled at the nanoscale over a crystalline sample can be used to reconstruct a strain map over a large area. However, it is important that the disk positions are measured accurately, as their positions relative to a reference are directly used to calculate strain. In this study, we compare several correlation methods using both simulated and experimental data in order to directly probe susceptibility to measurement error due to non-uniform diffracted disk illumination structure. We found that prefiltering the diffraction patterns with a Sobel filter before performing cross correlation or performing a square-root magnitude weighted phase correlation returned the best results when inner disk structure was present. We have tested these methods both on simulated datasets, and experimental data from unstrained silicon as well as a twin grain boundary in 304 stainless steel.

CL 19: Anisotropy of the electron diffraction from femtosecond Laser excited Bismuth

International Nuclear Information System (INIS)

Zhou, P.; Ligges, M.; Streubuehr, C.; Brazda, Th.; Payer, Th.; Meyer zu Heringdorf, F.; Horn-von Hoegen, M.; Von der Linde, D.

2010-01-01

We report an electron diffraction experiment in Bi in which a linearly polarized E g optical phonon mode is detected after excitation of the material by a femtosecond laser pulse. Bismuth is a semimetal with rhombohedral crystal structure with two atoms in the unit cell. There are two types of optical phonon modes: (i) The totally symmetric A 1g mode which corresponds to a displacement of the atoms along the trigonal (111) direction, and (ii) the doubly degenerate E g mode which represents a motion in the plane perpendicular to (111). The A 1g mode can be coherently excited both by displacive excitation (DE) and by impulsive stimulated Raman scattering (ISRS). Symmetry properties prevent DE of E g modes leaving ISRS as a likely excitation mechanism. We performed time resolved electron diffraction experiments on femtosecond laser excited Bi membranes of 15 nm thickness which were grown on a NaCl crystal and detached by floating in water. The experimental setup is described elsewhere. The fundamental laser beam (800 nm) was used for the excitation of the Bi films. The films had a crystalline structure with the (111) axis perpendicular to the surface. The electron beam passed perpendicular to the surface through the film. In this geometry the diffraction pattern is insensitive to atomic displacements along the (111) direction, i.e. insensitive to A 1g phonon modes. On the other hand, the excitation of E g modes corresponding to atomic displacements in the plane normal to (111) decreases the intensity of particular diffraction orders. The individual cycles of the E g vibrations (duration 475 fs) could not be resolved because our time resolution about 700 fs was not sufficient. In our experiment excitation beam with a fluence of 1 mJ/cm 2 and variable linear polarization was incident from the backside at an angle of 40 degrees (counter propagating electron and laser beam). The diffraction patterns were recorded as a function of the delay time between laser pump and

A pipeline for comprehensive and automated processing of electron diffraction data in IPLT.

Science.gov (United States)

Schenk, Andreas D; Philippsen, Ansgar; Engel, Andreas; Walz, Thomas

2013-05-01

Electron crystallography of two-dimensional crystals allows the structural study of membrane proteins in their native environment, the lipid bilayer. Determining the structure of a membrane protein at near-atomic resolution by electron crystallography remains, however, a very labor-intense and time-consuming task. To simplify and accelerate the data processing aspect of electron crystallography, we implemented a pipeline for the processing of electron diffraction data using the Image Processing Library and Toolbox (IPLT), which provides a modular, flexible, integrated, and extendable cross-platform, open-source framework for image processing. The diffraction data processing pipeline is organized as several independent modules implemented in Python. The modules can be accessed either from a graphical user interface or through a command line interface, thus meeting the needs of both novice and expert users. The low-level image processing algorithms are implemented in C++ to achieve optimal processing performance, and their interface is exported to Python using a wrapper. For enhanced performance, the Python processing modules are complemented with a central data managing facility that provides a caching infrastructure. The validity of our data processing algorithms was verified by processing a set of aquaporin-0 diffraction patterns with the IPLT pipeline and comparing the resulting merged data set with that obtained by processing the same diffraction patterns with the classical set of MRC programs. Copyright © 2013 Elsevier Inc. All rights reserved.

Development of a high repetition rate laser-plasma accelerator for ultra-fast electron diffraction experiments

International Nuclear Information System (INIS)

Beaurepaire, B.

2009-01-01

Electronic microscopy and electron diffraction allowed the understanding of the organization of atoms in matter. Using a temporally short source, one can measure atomic displacements or modifications of the electronic distribution in matter. To date, the best temporal resolution for time resolved diffraction experiments is of the order of a hundred femto-seconds (fs). Laser accelerators are good candidates to reach the femtosecond temporal resolution in electron diffraction experiments. Such accelerators used to work at a low repetition rate, so that it was necessary to develop a new one operating at a high repetition rate in order to accumulate a large amount of data. In this thesis, a laser-plasma accelerator operating at the kHz repetition rate was developed and built. This source generates electron bunches at 100 keV from 3 mJ and 25 fs laser pulses. The physics of the acceleration has been studied, and the effect of the laser wavefront on the electron transverse distribution has been demonstrated. (author)

Electron diffraction, elemental and image analysis of nanocrystals

Czech Academy of Sciences Publication Activity Database

Šlouf, Miroslav; Pavlova, Ewa; Hromádková, Jiřina; Králová, Daniela; Tyrpekl, Václav

2009-01-01

Roč. 16, 2a (2009), s. 33-34 ISSN 1211-5894. [Struktura - Colloquium of Czech and Slovak Crystallographic Association. Hluboká nad Vltavou, 22.06.2009-25.06.2009] R&D Projects: GA AV ČR KAN200520704; GA ČR GA203/07/0717 Institutional research plan: CEZ:AV0Z40500505 Keywords : TEM * electron diffraction * nanocrystals Subject RIV: CD - Macromolecular Chemistry

Electron back scattered diffraction study of SmCo magnets

International Nuclear Information System (INIS)

Yonamine, T.; Fukuhara, M.; Machado, R.; Missell, F.P.

2008-01-01

The remanence and energy product of permanent magnets is a strong function of their crystallographic texture. Electron back scattered diffraction (EBSD) is a tool for texture analysis providing information about the atomic layers up to 50 nm below the surface of the material. This paper discusses experimental requirements for performing EBSD measurements on rare-earth permanent magnets and presents results on commercial SmCo magnet material. EBSD measurements proved to be very sensitive to misaligned grains and were sensitive to texture in good agreement with information provided by X-ray diffraction scans. Results for nanostructured Sm(CoFeCuZr) z magnets are also discussed

A Medipix quantum area detector allows rotation electron diffraction data collection from submicrometre three-dimensional protein crystals

Energy Technology Data Exchange (ETDEWEB)

Nederlof, Igor; Genderen, Eric van; Li, Yao-Wang; Abrahams, Jan Pieter, E-mail: abrahams@chem.leidenuniv.nl [Leiden University, Einsteinweg 55, 2333 CC Leiden (Netherlands)

2013-07-01

An ultrasensitive Medipix2 detector allowed the collection of rotation electron-diffraction data from single three-dimensional protein nanocrystals for the first time. The data could be analysed using the standard X-ray crystallography programs MOSFLM and SCALA. When protein crystals are submicrometre-sized, X-ray radiation damage precludes conventional diffraction data collection. For crystals that are of the order of 100 nm in size, at best only single-shot diffraction patterns can be collected and rotation data collection has not been possible, irrespective of the diffraction technique used. Here, it is shown that at a very low electron dose (at most 0.1 e{sup −} Å{sup −2}), a Medipix2 quantum area detector is sufficiently sensitive to allow the collection of a 30-frame rotation series of 200 keV electron-diffraction data from a single ∼100 nm thick protein crystal. A highly parallel 200 keV electron beam (λ = 0.025 Å) allowed observation of the curvature of the Ewald sphere at low resolution, indicating a combined mosaic spread/beam divergence of at most 0.4°. This result shows that volumes of crystal with low mosaicity can be pinpointed in electron diffraction. It is also shown that strategies and data-analysis software (MOSFLM and SCALA) from X-ray protein crystallography can be used in principle for analysing electron-diffraction data from three-dimensional nanocrystals of proteins.

Femtosecond Electron Wave Packet Propagation and Diffraction: Towards Making the ``Molecular Movie"

Science.gov (United States)

Miller, R. J. Dwayne

2003-03-01

Time-resolved electron diffraction harbors great promise for achieving atomic resolution of the fastest chemical processes. The generation of sufficiently short electron pulses to achieve this real time view of a chemical reaction has been limited by problems in maintaining short electron pulses with realistic electron densities to the sample. The propagation dynamics of femtosecond electron packets in the drift region of a photoelectron gun are investigated with an N-body numerical simulation and mean-field model. This analyis shows that the redistribution of electrons inside the packet, arising from space-charge and dispersion contributions, changes the pulse envelope and leads to the development of a spatially linear axial velocity distribution. These results have been used in the design of femtosecond photoelectron guns with higher time resolution and novel electron-optical methods of pulse characterization that are approaching 100 fs timescales. Time-resolved diffraction studies with electron pulses of approximately 500 femtoseconds have focused on solid-liquid phase transitions under far from equilibrium conditions. This work gives a microscopic description of the melting process and illustrates the promise of atomically resolving transition state processes.

2D Spin-Dependent Diffraction of Electrons From Periodical Chains of Nanomagnets

Directory of Open Access Journals (Sweden)

Teshome Senbeta

2012-03-01

Full Text Available The scattering of the unpolarized beams of electrons by nanomagnets in the vicinity of some scattering angles leads to complete spin polarized electrons. This result is obtained with the help of the perturbation theory. The dipole-dipole interaction between the magnetic moment of the nanomagnet and the magnetic moment of electron is treated as perturbation. This interaction is not spherically symmetric. Rather it depends on the electron spin variables. It in turn results in spinor character of the scattering amplitudes. Due to the smallness of the magnetic interactions, the scattering length of this process is very small to be proved experimentally. To enhance the relevant scattering lengths, we considered the diffraction of unpolarized beams of electrons by linear chains of nanomagnets. By tuning the distance between the scatterers it is possible to obtain the diffraction maximum of the scattered electrons at scattering angles which corresponds to complete spin polarization of electrons. It is shown that the total differential scattering length is proportional to N2 (N is a number of scatterers. Even small number of nanomagnets in the chain helps to obtain experimentally visible enhancement of spin polarization of the scattered electrons.

Solving complex and disordered surface structures with electron diffraction

International Nuclear Information System (INIS)

Van Hove, M.A.

1987-10-01

The past of surface structure determination with low-energy electron diffraction (LEED) will be briefly reviewed, setting the stage for a discussion of recent and future developments. The aim of these developments is to solve complex and disordered surface structures. Some efficient solutions to the theoretical and experimental problems will be presented. Since the theoretical problems dominate, the emphasis will be on theoretical approaches to the calculation of the multiple scattering of electrons through complex and disordered surfaces. 49 refs., 13 figs., 1 tab

Card controlled beta backscatter thickness measuring instrument

International Nuclear Information System (INIS)

Schlesinger, J.

1978-01-01

An improved beta backscatter instrument for the nondestructive measurement of the thickness of thin coatings on a substrate is described. Included therein is the utilization of a bank of memory stored data representative of isotope, substrate, coating material and thickness range characteristics in association with a control card having predetermined indicia thereon selectively representative of a particular isotope, substrate material, coating material and thickness range for conditioning electronic circuit means by memory stored data selected in accord with the predetermined indicia on a control card for converting backscattered beta particle counts into indicia of coating thickness

Highlighting material structure with transmission electron diffraction correlation coefficient maps

International Nuclear Information System (INIS)

Kiss, Ákos K.; Rauch, Edgar F.; Lábár, János L.

2016-01-01

Correlation coefficient maps are constructed by computing the differences between neighboring diffraction patterns collected in a transmission electron microscope in scanning mode. The maps are shown to highlight material structural features like grain boundaries, second phase particles or dislocations. The inclination of the inner crystal interfaces are directly deduced from the resulting contrast. - Highlights: • We propose a novel technique to image the structure of polycrystalline TEM-samples. • Correlation coefficients maps highlights the evolution of the diffracting signal. • 3D views of grain boundaries are provided for nano-particles or polycrystals.

A Low-Temperature Electron Microscopy and Electron Diffraction Study of La1.84Sr0.16CuO4

Science.gov (United States)

Onozuka, Takashi; Omori, Mamoru; Hirabayashi, Makoto; Syono, Yasuhiko

1987-10-01

A high-Tc superconducting compound, La1.84Sr0.16CuO4, has been investigated by electron microscopy and electron diffraction in the range from 10 K to ambient temperature. The tetragonal K2NiF4-type structure undergoes an orthorhombic distortion below about 130 K. In the low-temperature phase, extra diffraction spots and twin lamellae are observed reversibly on cooling and heating in situ. Based on the observed results, a plausible structure model with orthorhombic distortion is proposed.

Structure refinement using precession electron diffraction tomography and dynamical diffraction: tests on experimental data

Czech Academy of Sciences Publication Activity Database

Palatinus, Lukáš; Correa, Cinthia Antunes; Steciuk, G.; Jacob, D.; Roussel, P.; Boullay, P.; Klementová, Mariana; Gemmi, M.; Kopeček, Jaromír; Domeneghetti, C.; Cámara, F.; Petříček, Václav

2015-01-01

Roč. 71, č. 6 (2015), 740-751 ISSN 2052-5206 R&D Projects: GA MŠk(CZ) LM2011029; GA ČR GA13-25747S; GA MŠk LO1409 Grant - others:SAFMAT(XE) CZ.2.16/3.1.00/22132; FUNBIO(XE) CZ.2.16/3.1.00/21568 Keywords : XRD * structure refinement * precession electron diffraction Subject RIV: BM - Solid Matter Physics ; Magnetism Impact factor: 2.892, year: 2015

Relativistic electron planar channeling and diffraction in thin monocrystals

International Nuclear Information System (INIS)

Vorob'ev, S.A.; Nurmagambetov, S.B.; Kaplin, V.V.; Rozum, E.I.

1985-01-01

The interaction of relativistic electrons with thin monocrystals was investigated in approximation of continuous potential of crystal plane system. Numerical technique for solution of one-dimensional Schroedinger equation with a periodic potential was developed. Numerical solutions conducted according to the technique were used to determine the forms of ngular distributions of electrons located in various zones of lteral motion. Calculation results were applied for analyzing experimentally obtained data on agular distribution of 5.1 MeV electrons projected at small angles onto the (110) planar system of a Si monocrystal. The conducted complex experimental and theoretical: investigations demonstrated the possibility of prevalen occupation of certain states of lateral motion and enabled to determine angular reg in directions of the electron beam projection on a crystal where either channeling effects or those of electron diffraction are important

Introduction to the theory of low-energy electron diffraction

International Nuclear Information System (INIS)

Fingerland, A.; Tomasek, M.

1975-01-01

An elementary introduction to the basic principles of the theory of low-energy electron diffraction is presented. General scattering theory is used to classify the hitherto known approaches to the problem (optical potential and one-electron approximation; formal scattering theory: Born expansion and multiple scattering; translational symmetry: Ewald construction; classification of LEED theories by means of the T matrix; pseudokinematical theory for crystal with clean surface and with an adsorbed monomolecular layer; dynamical theory; inclusion of inelastic collisions; discussion of a simple example by means of the band-structure approach)

Complete k-space visualization of x-ray photoelectron diffraction

International Nuclear Information System (INIS)

Denlinger, J.D.; Lawrence Berkeley Lab., CA; Rotenberg, E.; Lawrence Berkeley Lab., CA; Kevan, S.D.; Tonner, B.P.

1996-01-01

A highly detailed x-ray photoelectron diffraction data set has been acquired for crystalline Cu(001). The data set for bulk Cu 3p emission encompasses a large k-space volume (k = 3--10 angstrom -1 ) with sufficient energy and angular sampling to monitor the continuous variation of diffraction intensities. The evolution of back-scattered intensity oscillations is visualized by energy and angular slices of this volume data set. Large diffraction data sets such as this will provide rigorous experimental tests of real-space reconstruction algorithms and multiple-scattering simulations

A low-temperature electron microscopy and electron diffraction study of La1.84Sr0.16CuO4

International Nuclear Information System (INIS)

Onozuka, Takashi; Omori, Mamoru; Hirabayashi, Makoto; Syono, Yasuhiko

1987-01-01

A high-T c superconducting compound, La 1.84 Sr 0.16 CuO 4 , has been investigated by electron microscopy and electron diffraction in the range from 10 K to ambient temperature. The tetragonal K 2 NiF 4 -type structure undergoes an orthorhombic distortion below about 130 K. In the low-temperature phase, extra diffraction spots and twin lamellae are observed reversibly on cooling and heating in situ. Based on the observed results, a plausible structure model with orthorhombic distortion is proposed. (author)

Acceleration of Electrons in a Diffraction Dominated IFEL

CERN Document Server

Musumeci, Pietro; Pellegrini, Claudio; Ralph, J; Rosenzweig, J B; Sung, C; Tochitsky, Sergei Ya; Travish, Gil

2004-01-01

We report on the observation of energy gain in excess of 20 MeV at the Inverse Free Electron Laser Accelerator experiment at the Neptune Laboratory at UCLA. A 14.5 MeV electron beam is injected ina 50 cm long undulator strongly tapered both in period and field amplitude. A CO2 10 μ m laser with power >300 GW is used as the IFEL driver. The Rayleigh range of the laser (1.8cm) is shorter than the undulator length so that the interaction is diffraction dominated. Few per cent of the injected particles are trapped in stable accelerating buckets and electrons with energies up to 35 MeV are detected on the magnetic spectrometers. Experimental results on the scaling of the accelerator characteristics versus input parameters like injection energy, laser focus position and laser power are discussed. Three dimensional simulations are in good agreement with the electron energy spectrums observed in the experiment and indicate that substantial energy exchange between laser and electron beam only occurs in the firs...

Thermal expansion coefficient measurement from electron diffraction of amorphous films in a TEM.

Science.gov (United States)

Hayashida, Misa; Cui, Kai; Malac, Marek; Egerton, Ray

2018-05-01

We measured the linear thermal expansion coefficients of amorphous 5-30 nm thick SiN and 17 nm thick Formvar/Carbon (F/C) films using electron diffraction in a transmission electron microscope. Positive thermal expansion coefficient (TEC) was observed in SiN but negative coefficients in the F/C films. In case of amorphous carbon (aC) films, we could not measure TEC because the diffraction radii required several hours to stabilize at a fixed temperature. Crown Copyright © 2018. Published by Elsevier B.V. All rights reserved.

Simulation of multistatic and backscattering cross sections for airborne radar

Science.gov (United States)

Biggs, Albert W.

1986-07-01

In order to determine susceptibilities of airborne radar to electronic countermeasures and electronic counter-countermeasures simulations of multistatic and backscattering cross sections were developed as digital modules in the form of algorithms. Cross section algorithms are described for prolate (cigar shape) and oblate (disk shape) spheroids. Backscattering cross section algorithms are also described for different categories of terrain. Backscattering cross section computer programs were written for terrain categorized as vegetation, sea ice, glacial ice, geological (rocks, sand, hills, etc.), oceans, man-made structures, and water bodies. PROGRAM SIGTERRA is a file for backscattering cross section modules of terrain (TERRA) such as vegetation (AGCROP), oceans (OCEAN), Arctic sea ice (SEAICE), glacial snow (GLASNO), geological structures (GEOL), man-made structures (MAMMAD), or water bodies (WATER). AGCROP describes agricultural crops, trees or forests, prairies or grassland, and shrubs or bush cover. OCEAN has the SLAR or SAR looking downwind, upwind, and crosswind at the ocean surface. SEAICE looks at winter ice and old or polar ice. GLASNO is divided into a glacial ice and snow or snowfields. MANMAD includes buildings, houses, roads, railroad tracks, airfields and hangars, telephone and power lines, barges, trucks, trains, and automobiles. WATER has lakes, rivers, canals, and swamps. PROGRAM SIGAIR is a similar file for airborne targets such as prolate and oblate spheroids.

'Diffraction-free' optical beams in inverse free electron laser accelerators

International Nuclear Information System (INIS)

Cai, S.Y.; Bhattacharjee, A.; Marshall, T.C.

1988-01-01

'Diffraction-free' optical beams correspond to exact solutions of the wave equation in free space with the remarkable property that they propagate with negligible transverse spreading for distances much larger than the Rayleigh range. The requirement for this to occur is a large aperture. Using a 2D computer code, we find that these optical beams will also propagate with negligible diffraction even when perturbed by the electron beam in an IFEL; indeed they match well the FEL requirement for the accelerator. The numerical simulations are performed for the proposed facility at Brookhaven in which λ s =10 μm, B=1.5 T (linearly tapered l w =1.31-6.28 cm) and the optical beam power is either 8x10 11 W or 2.3x10 10 W. Approximately 70% of the electrons constituting a beam of current 5 mA or 15 A, radius 0.14 mm and initial energy of 50 MeV is accelerated at 50 MeV/m. (orig.)

Backscatter, anisotropy, and polarization of solar hard X-rays

International Nuclear Information System (INIS)

Bai, T.; Ramaty, R.

1978-01-01

Hard X-rays incident upon the photosphere with energies > or approx. =15 keV have high probabilities of backscatter due to Compton collisions with electrons. This effect has a strong influence on the spectrum, intensity, and polarization of solar hard X-rays - especially for anisotropic models in which the primary X-rays are emitted predominantly toward the photosphere. We have carried out a detailed study of X-ray backscatter, and we have investigated the interrelated problems of anisotropy, polarization, center-to-limb variation of the X-ray spectrum, and Compton backscatter in a coherent fashion. The results of this study are compared with observational data. Because of the large contribution from backscatter, for an anisotropic primary X-ray source which is due to bremsstrahlung of accelerated electrons moving predominantly down toward the photosphere, the observed X-ray flux around 30 keV does not depend significantly on the position of flare on the Sun. For such an anisotropic source, the X-ray spectrum observed in the 15-50 keV range becomes steeper with the increasing heliocentric angle of the flare. These results are compatible with the data. The degree of polarization of the sum of the primary and reflected X-rays with energies between about 15 and 30 keV can be very large for anisotropic primary X-ray sources, but it is less than about 4% for isotropic sources. We also discuss the characteristics of the brightness distribution of the X-ray albedo patch created by the Compton backscatter. The height and anisotropy of the primary hard X-ray source might be inferred from the study of the albedo patch

Elucidating structural order and disorder phenomena in mullite-type Al4B2O9 by automated electron diffraction tomography

International Nuclear Information System (INIS)

Zhao, Haishuang; Krysiak, Yaşar; Hoffmann, Kristin; Barton, Bastian; Molina-Luna, Leopoldo; Neder, Reinhard B.; Kleebe, Hans-Joachim; Gesing, Thorsten M.; Schneider, Hartmut; Fischer, Reinhard X.

2017-01-01

The crystal structure and disorder phenomena of Al 4 B 2 O 9 , an aluminum borate from the mullite-type family, were studied using automated diffraction tomography (ADT), a recently established method for collection and analysis of electron diffraction data. Al 4 B 2 O 9 , prepared by sol-gel approach, crystallizes in the monoclinic space group C2/m. The ab initio structure determination based on three-dimensional electron diffraction data from single ordered crystals reveals that edge-connected AlO 6 octahedra expanding along the b axis constitute the backbone. The ordered structure (A) was confirmed by TEM and HAADF-STEM images. Furthermore, disordered crystals with diffuse scattering along the b axis are observed. Analysis of the modulation pattern implies a mean superstructure (AAB) with a threefold b axis, where B corresponds to an A layer shifted by ½a and ½c. Diffraction patterns simulated for the AAB sequence including additional stacking disorder are in good agreement with experimental electron diffraction patterns. - Graphical abstract: Crystal structure and disorder phenomena of B-rich Al 4 B 2 O 9 studied by automated electron diffraction tomography (ADT) and described by diffraction simulation using DISCUS. - Highlights: • Ab-initio structure solution by electron diffraction from single nanocrystals. • Detected modulation corresponding mainly to three-fold superstructure. • Diffuse diffraction streaks caused by stacking faults in disordered crystals. • Observed streaks explained by simulated electron diffraction patterns.

Ab-initio crystal structure analysis and refinement approaches of oligo p-benzamides based on electron diffraction data

DEFF Research Database (Denmark)

Gorelik, Tatiana E; van de Streek, Jacco; Kilbinger, Andreas F M

2012-01-01

Ab-initio crystal structure analysis of organic materials from electron diffraction data is presented. The data were collected using the automated electron diffraction tomography (ADT) technique. The structure solution and refinement route is first validated on the basis of the known crystal stru...

Three-dimensional rotation electron diffraction: software RED for automated data collection and data processing.

Science.gov (United States)

Wan, Wei; Sun, Junliang; Su, Jie; Hovmöller, Sven; Zou, Xiaodong

2013-12-01

Implementation of a computer program package for automated collection and processing of rotation electron diffraction (RED) data is described. The software package contains two computer programs: RED data collection and RED data processing. The RED data collection program controls the transmission electron microscope and the camera. Electron beam tilts at a fine step (0.05-0.20°) are combined with goniometer tilts at a coarse step (2.0-3.0°) around a common tilt axis, which allows a fine relative tilt to be achieved between the electron beam and the crystal in a large tilt range. An electron diffraction (ED) frame is collected at each combination of beam tilt and goniometer tilt. The RED data processing program processes three-dimensional ED data generated by the RED data collection program or by other approaches. It includes shift correction of the ED frames, peak hunting for diffraction spots in individual ED frames and identification of these diffraction spots as reflections in three dimensions. Unit-cell parameters are determined from the positions of reflections in three-dimensional reciprocal space. All reflections are indexed, and finally a list with hkl indices and intensities is output. The data processing program also includes a visualizer to view and analyse three-dimensional reciprocal lattices reconstructed from the ED frames. Details of the implementation are described. Data collection and data processing with the software RED are demonstrated using a calcined zeolite sample, silicalite-1. The structure of the calcined silicalite-1, with 72 unique atoms, could be solved from the RED data by routine direct methods.

Reciprocal space mapping by spot profile analyzing low energy electron diffraction

International Nuclear Information System (INIS)

Meyer zu Heringdorf, Frank-J.; Horn-von Hoegen, Michael

2005-01-01

We present an experimental approach for the recording of two-dimensional reciprocal space maps using spot profile analyzing low energy electron diffraction (SPA-LEED). A specialized alignment procedure eliminates the shifting of LEED patterns on the screen which is commonly observed upon variation of the electron energy. After the alignment, a set of one-dimensional sections through the diffraction pattern is recorded at different energies. A freely available software tool is used to assemble the sections into a reciprocal space map. The necessary modifications of the Burr-Brown computer interface of the two Leybold and Omicron type SPA-LEED instruments are discussed and step-by-step instructions are given to adapt the SPA 4.1d software to the changed hardware. Au induced faceting of 4 deg. vicinal Si(001) is used as an example to demonstrate the technique

Three-dimensional electron diffraction as a complementary technique to powder X-ray diffraction for phase identification and structure solution of powders

Directory of Open Access Journals (Sweden)

Yifeng Yun

2015-03-01

Full Text Available Phase identification and structure determination are important and widely used techniques in chemistry, physics and materials science. Recently, two methods for automated three-dimensional electron diffraction (ED data collection, namely automated diffraction tomography (ADT and rotation electron diffraction (RED, have been developed. Compared with X-ray diffraction (XRD and two-dimensional zonal ED, three-dimensional ED methods have many advantages in identifying phases and determining unknown structures. Almost complete three-dimensional ED data can be collected using the ADT and RED methods. Since each ED pattern is usually measured off the zone axes by three-dimensional ED methods, dynamic effects are much reduced compared with zonal ED patterns. Data collection is easy and fast, and can start at any arbitrary orientation of the crystal, which facilitates automation. Three-dimensional ED is a powerful technique for structure identification and structure solution from individual nano- or micron-sized particles, while powder X-ray diffraction (PXRD provides information from all phases present in a sample. ED suffers from dynamic scattering, while PXRD data are kinematic. Three-dimensional ED methods and PXRD are complementary and their combinations are promising for studying multiphase samples and complicated crystal structures. Here, two three-dimensional ED methods, ADT and RED, are described. Examples are given of combinations of three-dimensional ED methods and PXRD for phase identification and structure determination over a large number of different materials, from Ni–Se–O–Cl crystals, zeolites, germanates, metal–organic frameworks and organic compounds to intermetallics with modulated structures. It is shown that three-dimensional ED is now as feasible as X-ray diffraction for phase identification and structure solution, but still needs further development in order to be as accurate as X-ray diffraction. It is expected that three

Three-dimensional electron diffraction as a complementary technique to powder X-ray diffraction for phase identification and structure solution of powders.

Science.gov (United States)

Yun, Yifeng; Zou, Xiaodong; Hovmöller, Sven; Wan, Wei

2015-03-01

Phase identification and structure determination are important and widely used techniques in chemistry, physics and materials science. Recently, two methods for automated three-dimensional electron diffraction (ED) data collection, namely automated diffraction tomography (ADT) and rotation electron diffraction (RED), have been developed. Compared with X-ray diffraction (XRD) and two-dimensional zonal ED, three-dimensional ED methods have many advantages in identifying phases and determining unknown structures. Almost complete three-dimensional ED data can be collected using the ADT and RED methods. Since each ED pattern is usually measured off the zone axes by three-dimensional ED methods, dynamic effects are much reduced compared with zonal ED patterns. Data collection is easy and fast, and can start at any arbitrary orientation of the crystal, which facilitates automation. Three-dimensional ED is a powerful technique for structure identification and structure solution from individual nano- or micron-sized particles, while powder X-ray diffraction (PXRD) provides information from all phases present in a sample. ED suffers from dynamic scattering, while PXRD data are kinematic. Three-dimensional ED methods and PXRD are complementary and their combinations are promising for studying multiphase samples and complicated crystal structures. Here, two three-dimensional ED methods, ADT and RED, are described. Examples are given of combinations of three-dimensional ED methods and PXRD for phase identification and structure determination over a large number of different materials, from Ni-Se-O-Cl crystals, zeolites, germanates, metal-organic frameworks and organic compounds to intermetallics with modulated structures. It is shown that three-dimensional ED is now as feasible as X-ray diffraction for phase identification and structure solution, but still needs further development in order to be as accurate as X-ray diffraction. It is expected that three-dimensional ED methods

High resolution electron microscopy and electron diffraction of YBa2Cu3O(7-x)

International Nuclear Information System (INIS)

Krakow, W.; Shaw, T.M.

1988-01-01

Experimental high resolution electron micrographs and computer simulation experiments have been used to evaluate the visibility of the atomic constituents of YBa 2 Cu 3 O(7-x). In practice, the detection of oxygen has not been possible in contradiction to that predicted by modelling of perfect crystalline material. Preliminary computer experiments of the electron diffraction patterns when oxygen vacancies are introduced on the Cu-O sheets separating Ba layers show the diffuse streaks characteristic of short range ordering. 7 references

Low-energy positron and electron diffraction and positron-stimulated secondary electron emission from Cu(100)

International Nuclear Information System (INIS)

Weiss, A.H.

1983-01-01

The results of two series of experiments are reported. In the first, an electrostatically guided beam of low-energy (40-400 eV) positrons, delta/sub p/ was used to study low-energy positron diffraction (LEPD) from a Cu(100) surface under ultrahigh-vacuum conditions. Low-energy electron diffraction (LEED) data were obtained from the same sample in the same apparatus. Comparison of LEPD and LEED intensity versus energy data with model calculations made using computer programs developed by C.B. Duke and collaborators indicated that: LEPD data is adequately modeled using potentials with no exchange-correlation term. The inelastic mean free path, lambda/sub ee/, is shorter for positrons than for electrons at low (< approx.80 eV). LEED is better than LEPD at making a determination of the first-layer spacing of Cu(100) for the particular data set reported. In the second set of experiments, the same apparatus and sample were used to compare positron- and electron-stimulated secondary-electron emission (PSSEE and ESSEE). The results were found to be consistent with existing models of secondary-electron production for metals. The energy distributions of secondary-electrons had broad low-energy (<10 eV) peaks for both positron and electron stimulation. But the PSEE distribution showed no elastic peak. Measurements of secondary-electron angular distributions, found to be cosine-like in both the PSSEE and ESSEE case, were used to obtain total secondary yield ratios, delta, at four beam energies ranging from 40-400 eV. The secondary yield ratio for primary positrons and the yield for primary electrons, delta/sub e/, were similar at these energies. For 400-eV primary particles the secondary yields were found to be delta/sub p/ = 0.94 +/- 0.12 and delta/sub e/ = 0.94 +/- 0./12, giving a ratio of unity for positron-stimulated secondary yield to electron-stimulated secondary yield

Ab initio structure determination of nanocrystals of organic pharmaceutical compounds by electron diffraction at room temperature using a Timepix quantum area direct electron detector

Energy Technology Data Exchange (ETDEWEB)

Genderen, E. van; Clabbers, M. T. B. [Biophysical Structural Chemistry, Leiden University, Einsteinweg 55, 2333 CC Leiden (Netherlands); Center for Cellular Imaging and NanoAnalytics (C-CINA), Biozentrum, University of Basel, CH-4058 Basel (Switzerland); Das, P. P. [Nanomegas SPRL, Boulevard Edmond Machtens 79, B 1080, Brussels (Belgium); Stewart, A. [Department of Physics and Energy, Materials and Surface Science Institute (MSSI), University of Limerick, Limerick (Ireland); Nederlof, I. [Biophysical Structural Chemistry, Leiden University, Einsteinweg 55, 2333 CC Leiden (Netherlands); Amsterdam Scientific Instruments, Postbus 41882, 1009 DB Amsterdam (Netherlands); Barentsen, K. C. [Biophysical Structural Chemistry, Leiden University, Einsteinweg 55, 2333 CC Leiden (Netherlands); Portillo, Q. [Nanomegas SPRL, Boulevard Edmond Machtens 79, B 1080, Brussels (Belgium); Centres Científics i Tecnològics de la Universitat de Barcelona, University of Barcelona, Carrer de Lluís Solé i Sabaris, 1-3, Barcelona (Spain); Pannu, N. S. [Biophysical Structural Chemistry, Leiden University, Einsteinweg 55, 2333 CC Leiden (Netherlands); Nicolopoulos, S. [Nanomegas SPRL, Boulevard Edmond Machtens 79, B 1080, Brussels (Belgium); Gruene, T., E-mail: tim.gruene@psi.ch [Biology and Chemistry, Laboratory of Biomolecular Research, Paul Scherrer Institute (PSI), 5232 Villigen (Switzerland); Abrahams, J. P., E-mail: tim.gruene@psi.ch [Biophysical Structural Chemistry, Leiden University, Einsteinweg 55, 2333 CC Leiden (Netherlands); Center for Cellular Imaging and NanoAnalytics (C-CINA), Biozentrum, University of Basel, CH-4058 Basel (Switzerland); Biology and Chemistry, Laboratory of Biomolecular Research, Paul Scherrer Institute (PSI), 5232 Villigen (Switzerland)

2016-02-05

A specialized quantum area detector for electron diffraction studies makes it possible to solve the structure of small organic compound nanocrystals in non-cryo conditions by direct methods. Until recently, structure determination by transmission electron microscopy of beam-sensitive three-dimensional nanocrystals required electron diffraction tomography data collection at liquid-nitrogen temperature, in order to reduce radiation damage. Here it is shown that the novel Timepix detector combines a high dynamic range with a very high signal-to-noise ratio and single-electron sensitivity, enabling ab initio phasing of beam-sensitive organic compounds. Low-dose electron diffraction data (∼0.013 e{sup −} Å{sup −2} s{sup −1}) were collected at room temperature with the rotation method. It was ascertained that the data were of sufficient quality for structure solution using direct methods using software developed for X-ray crystallography (XDS, SHELX) and for electron crystallography (ADT3D/PETS, SIR2014)

High quality single shot diffraction patterns using ultrashort megaelectron volt electron beams from a radio frequency photoinjector

Energy Technology Data Exchange (ETDEWEB)

Musumeci, P.; Moody, J. T.; Scoby, C. M.; Gutierrez, M. S. [Department of Physics and Astronomy, UCLA, Los Angeles, California 90095 (United States); Bender, H. A.; Wilcox, N. S. [National Security Technologies, LLC, Los Alamos Operations, Los Alamos, New Mexico 87544 (United States)

2010-01-15

Single shot diffraction patterns using a 250-fs-long electron beam have been obtained at the UCLA Pegasus laboratory. High quality images with spatial resolution sufficient to distinguish closely spaced peaks in the Debye-Scherrer ring pattern have been recorded by scattering the 1.6 pC 3.5 MeV electron beam generated in the rf photoinjector off a 100-nm-thick Au foil. Dark current and high emittance particles are removed from the beam before sending it onto the diffraction target using a 1 mm diameter collimating hole. These results open the door to the study of irreversible phase transformations by single shot MeV electron diffraction.

High quality single shot diffraction patterns using ultrashort megaelectron volt electron beams from a radio frequency photoinjector.

Science.gov (United States)

Musumeci, P; Moody, J T; Scoby, C M; Gutierrez, M S; Bender, H A; Wilcox, N S

2010-01-01

Single shot diffraction patterns using a 250-fs-long electron beam have been obtained at the UCLA Pegasus laboratory. High quality images with spatial resolution sufficient to distinguish closely spaced peaks in the Debye-Scherrer ring pattern have been recorded by scattering the 1.6 pC 3.5 MeV electron beam generated in the rf photoinjector off a 100-nm-thick Au foil. Dark current and high emittance particles are removed from the beam before sending it onto the diffraction target using a 1 mm diameter collimating hole. These results open the door to the study of irreversible phase transformations by single shot MeV electron diffraction.

High quality single shot diffraction patterns using ultrashort megaelectron volt electron beams from a radio frequency photoinjector

International Nuclear Information System (INIS)

Musumeci, P.; Moody, J. T.; Scoby, C. M.; Gutierrez, M. S.; Bender, H. A.; Wilcox, N. S.

2010-01-01

Single shot diffraction patterns using a 250-fs-long electron beam have been obtained at the UCLA Pegasus laboratory. High quality images with spatial resolution sufficient to distinguish closely spaced peaks in the Debye-Scherrer ring pattern have been recorded by scattering the 1.6 pC 3.5 MeV electron beam generated in the rf photoinjector off a 100-nm-thick Au foil. Dark current and high emittance particles are removed from the beam before sending it onto the diffraction target using a 1 mm diameter collimating hole. These results open the door to the study of irreversible phase transformations by single shot MeV electron diffraction.

Interpretation of diffuse low-energy electron diffraction intensities

International Nuclear Information System (INIS)

Saldin, D.K.; Pendry, J.B.; Van Hove, M.A.; Somorjai, G.A.

1985-01-01

It is shown that the diffuse low-energy electron diffraction (LEED) that occurs between sharp LEED beams can be used to determine the local bonding configuration near disordered surface atoms. Two approaches to the calculation of diffuse LEED intensities are presented for the case of lattice-gas disorder of an adsorbate on a crystalline substrate. The capabilities of this technique are most similar to those of near-edge extended x-ray absorption fine structure, but avoid the restrictions due to the use of photons

Computer programs for unit-cell determination in electron diffraction experiments

International Nuclear Information System (INIS)

Li, X.Z.

2005-01-01

A set of computer programs for unit-cell determination from an electron diffraction tilt series and pattern indexing has been developed on the basis of several well-established algorithms. In this approach, a reduced direct primitive cell is first determined from experimental data, in the means time, the measurement errors of the tilt angles are checked and minimized. The derived primitive cell is then checked for possible higher lattice symmetry and transformed into a proper conventional cell. Finally a least-squares refinement procedure is adopted to generate optimum lattice parameters on the basis of the lengths of basic reflections in each diffraction pattern and the indices of these reflections. Examples are given to show the usage of the programs

Giant Andreev Backscattering through a Quantum Point Contact Coupled via a Disordered Two-Dimensional Electron Gas to Superconductors

International Nuclear Information System (INIS)

den Hartog, S.G.; van Wees, B.J.; Klapwijk, T.M.; Nazarov, Y.V.; Borghs, G.

1997-01-01

We have investigated the superconducting-phase-modulated reduction in the resistance of a ballistic quantum point contact (QPC) connected via a disordered two-dimensional electron gas (2DEG) to superconductors. We show that this reduction is caused by coherent Andreev backscattering of holes through the QPC, which increases monotonically by reducing the bias voltage to zero. In contrast, the magnitude of the phase-dependent resistance of the disordered 2DEG displays a nonmonotonic reentrant behavior versus bias voltage. copyright 1997 The American Physical Society

Accurate electron channeling contrast analysis of a low angle sub-grain boundary

International Nuclear Information System (INIS)

Mansour, H.; Crimp, M.A.; Gey, N.; Maloufi, N.

2015-01-01

High resolution selected area channeling pattern (HR-SACP) assisted accurate electron channeling contrast imaging (A-ECCI) was used to unambiguously characterize the structure of a low angle grain boundary in an interstitial-free-steel. The boundary dislocations were characterized using TEM-style contrast analysis. The boundary was determined to be tilt in nature with a misorientation angle of 0.13° consistent with the HR-SACP measurements. The results were verified using high accuracy electron backscatter diffraction (EBSD), confirming the approach as a discriminating tool for assessing low angle boundaries

Ultrashort electron bunch length measurement with diffraction radiation deflector

Science.gov (United States)

Xiang, Dao; Huang, Wen-Hui

2007-01-01

In this paper, we propose a novel method to measure electron bunch length with a diffraction radiation (DR) deflector which is composed of a DR radiator and three beam position monitors (BPMs). When an electron beam passes through a metallic aperture which is tilted by 45 degrees with respect to its trajectory, backward DR that propagates perpendicular to the beam’s trajectory is generated which adds a transverse deflection to the beam as a result of momentum conservation. The deflection is found to be largely dependent on the bunch length and could be easily observed with a downstream BPM. Detailed investigations show that this method has wide applicability, high temporal resolution, and great simplicity.

Ultrashort electron bunch length measurement with diffraction radiation deflector

Directory of Open Access Journals (Sweden)

Dao Xiang

2007-01-01

Full Text Available In this paper, we propose a novel method to measure electron bunch length with a diffraction radiation (DR deflector which is composed of a DR radiator and three beam position monitors (BPMs. When an electron beam passes through a metallic aperture which is tilted by 45 degrees with respect to its trajectory, backward DR that propagates perpendicular to the beam’s trajectory is generated which adds a transverse deflection to the beam as a result of momentum conservation. The deflection is found to be largely dependent on the bunch length and could be easily observed with a downstream BPM. Detailed investigations show that this method has wide applicability, high temporal resolution, and great simplicity.

Low-temperature electron microscopy and electron diffraction study of La/sub 1. 84/Sr/sub 0. 16/CuO/sub 4/

Energy Technology Data Exchange (ETDEWEB)

Onozuka, Takashi; Omori, Mamoru; Hirabayashi, Makoto; Syono, Yasuhiko

1987-10-01

A high-T/sub c/ superconducting compound, La/sub 1.84/Sr/sub 0.16/CuO/sub 4/, has been investigated by electron microscopy and electron diffraction in the range from 10 K to ambient temperature. The tetragonal K/sub 2/NiF/sub 4/-type structure undergoes an orthorhombic distortion below about 130 K. In the low-temperature phase, extra diffraction spots and twin lamellae are observed reversibly on cooling and heating in situ. Based on the observed results, a plausible structure model with orthorhombic distortion is proposed

Dynamical electron diffraction simulation for non-orthogonal crystal system by a revised real space method.

Science.gov (United States)

Lv, C L; Liu, Q B; Cai, C Y; Huang, J; Zhou, G W; Wang, Y G

2015-01-01

In the transmission electron microscopy, a revised real space (RRS) method has been confirmed to be a more accurate dynamical electron diffraction simulation method for low-energy electron diffraction than the conventional multislice method (CMS). However, the RRS method can be only used to calculate the dynamical electron diffraction of orthogonal crystal system. In this work, the expression of the RRS method for non-orthogonal crystal system is derived. By taking Na2 Ti3 O7 and Si as examples, the correctness of the derived RRS formula for non-orthogonal crystal system is confirmed by testing the coincidence of numerical results of both sides of Schrödinger equation; moreover, the difference between the RRS method and the CMS for non-orthogonal crystal system is compared at the accelerating voltage range from 40 to 10 kV. Our results show that the CMS method is almost the same as the RRS method for the accelerating voltage above 40 kV. However, when the accelerating voltage is further lowered to 20 kV or below, the CMS method introduces significant errors, not only for the higher-order Laue zone diffractions, but also for zero-order Laue zone. These indicate that the RRS method for non-orthogonal crystal system is necessary to be used for more accurate dynamical simulation when the accelerating voltage is low. Furthermore, the reason for the increase of differences between those diffraction patterns calculated by the RRS method and the CMS method with the decrease of the accelerating voltage is discussed. © 2015 The Authors Journal of Microscopy © 2015 Royal Microscopical Society.

Data processing software suite SITENNO for coherent X-ray diffraction imaging using the X-ray free-electron laser SACLA

International Nuclear Information System (INIS)

Sekiguchi, Yuki; Oroguchi, Tomotaka; Takayama, Yuki; Nakasako, Masayoshi

2014-01-01

The software suite SITENNO is developed for processing diffraction data collected in coherent X-ray diffraction imaging experiments of non-crystalline particles using an X-ray free-electron laser. Coherent X-ray diffraction imaging is a promising technique for visualizing the structures of non-crystalline particles with dimensions of micrometers to sub-micrometers. Recently, X-ray free-electron laser sources have enabled efficient experiments in the ‘diffraction before destruction’ scheme. Diffraction experiments have been conducted at SPring-8 Angstrom Compact free-electron LAser (SACLA) using the custom-made diffraction apparatus KOTOBUKI-1 and two multiport CCD detectors. In the experiments, ten thousands of single-shot diffraction patterns can be collected within several hours. Then, diffraction patterns with significant levels of intensity suitable for structural analysis must be found, direct-beam positions in diffraction patterns determined, diffraction patterns from the two CCD detectors merged, and phase-retrieval calculations for structural analyses performed. A software suite named SITENNO has been developed to semi-automatically apply the four-step processing to a huge number of diffraction data. Here, details of the algorithm used in the suite are described and the performance for approximately 9000 diffraction patterns collected from cuboid-shaped copper oxide particles reported. Using the SITENNO suite, it is possible to conduct experiments with data processing immediately after the data collection, and to characterize the size distribution and internal structures of the non-crystalline particles

Monte-Carlo study of the influence of backscattered electrons on the transmission of a mini-orange β spectrometer

Science.gov (United States)

Detistov, Pavel; Balabanski, Dimiter L.

2015-04-01

This work work is a part of the performance investigation of the recently constructed Mini-Orange beta spectrometer. The spectrometer has eight different configurations using three different magnet shapes and combination of three, four, and six magnet pieces allowing detection of electrons in wide kinetic energy range. The performance of the device is studied using the GEANT4 simulation tool. Evaluation of the device's basic parameters has been made, paying special attention to the backscattering, for which a study of the dependence of this process on the energy and the angle is made.

Highlighting material structure with transmission electron diffraction correlation coefficient maps.

Science.gov (United States)

Kiss, Ákos K; Rauch, Edgar F; Lábár, János L

2016-04-01

Correlation coefficient maps are constructed by computing the differences between neighboring diffraction patterns collected in a transmission electron microscope in scanning mode. The maps are shown to highlight material structural features like grain boundaries, second phase particles or dislocations. The inclination of the inner crystal interfaces are directly deduced from the resulting contrast. Copyright © 2016 Elsevier B.V. All rights reserved.

Determination of the Projected Atomic Potential by Deconvolution of the Auto-Correlation Function of TEM Electron Nano-Diffraction Patterns

Directory of Open Access Journals (Sweden)

Liberato De Caro

2016-11-01

Full Text Available We present a novel method to determine the projected atomic potential of a specimen directly from transmission electron microscopy coherent electron nano-diffraction patterns, overcoming common limitations encountered so far due to the dynamical nature of electron-matter interaction. The projected potential is obtained by deconvolution of the inverse Fourier transform of experimental diffraction patterns rescaled in intensity by using theoretical values of the kinematical atomic scattering factors. This novelty enables the compensation of dynamical effects typical of transmission electron microscopy (TEM experiments on standard specimens with thicknesses up to a few tens of nm. The projected atomic potentials so obtained are averaged on sample regions illuminated by nano-sized electron probes and are in good quantitative agreement with theoretical expectations. Contrary to lens-based microscopy, here the spatial resolution in the retrieved projected atomic potential profiles is related to the finer lattice spacing measured in the electron diffraction pattern. The method has been successfully applied to experimental nano-diffraction data of crystalline centrosymmetric and non-centrosymmetric specimens achieving a resolution of 65 pm.

ILC beam energy measurement by means of laser Compton backscattering

Energy Technology Data Exchange (ETDEWEB)

Muchnoi, N. [Budker Inst. for Nuclear Physics, Novosibirsk (Russian Federation); Schreiber, H.J.; Viti, M. [Deutsches Elektronen-Synchrotron (DESY), Zeuthen (Germany)

2008-10-15

A novel, non-invasive method of measuring the beam energy at the International Linear Collider is proposed. Laser light collides head-on with beam particles and either the energy of the Compton scattered electrons near the kinematic end-point is measured or the positions of the Compton backscattered {gamma}-rays, the edge electrons and the unscattered beam particles are recorded. A compact layout for the Compton spectrometer is suggested. It consists of a bending magnet and position sensitive detectors operating in a large radiation environment. Several options for high spatial resolution detectors are discussed. Simulation studies support the use of an infrared or green laser and quartz fiber detectors to monitor the backscattered photons and edge electrons. Employing a cavity monitor, the beam particle position downstream of the magnet can be recorded with submicrometer precision. Such a scheme provides a feasible and promising method to access the incident beam energy with precisions of 10{sup -4} or better on a bunch-to-bunch basis while the electron and positron beams are in collision. (orig.)

ILC beam energy measurement by means of laser Compton backscattering

International Nuclear Information System (INIS)

Muchnoi, N.; Schreiber, H.J.; Viti, M.

2008-10-01

A novel, non-invasive method of measuring the beam energy at the International Linear Collider is proposed. Laser light collides head-on with beam particles and either the energy of the Compton scattered electrons near the kinematic end-point is measured or the positions of the Compton backscattered γ-rays, the edge electrons and the unscattered beam particles are recorded. A compact layout for the Compton spectrometer is suggested. It consists of a bending magnet and position sensitive detectors operating in a large radiation environment. Several options for high spatial resolution detectors are discussed. Simulation studies support the use of an infrared or green laser and quartz fiber detectors to monitor the backscattered photons and edge electrons. Employing a cavity monitor, the beam particle position downstream of the magnet can be recorded with submicrometer precision. Such a scheme provides a feasible and promising method to access the incident beam energy with precisions of 10 -4 or better on a bunch-to-bunch basis while the electron and positron beams are in collision. (orig.)

Foucault imaging and small-angle electron diffraction in controlled external magnetic fields.

Science.gov (United States)

Nakajima, Hiroshi; Kotani, Atsuhiro; Harada, Ken; Ishii, Yui; Mori, Shigeo

2016-12-01

We report a method for acquiring Foucault images and small-angle electron diffraction patterns in external magnetic fields using a conventional transmission electron microscope without any modification. In the electron optical system that we have constructed, external magnetic fields parallel to the optical axis can be controlled using the objective lens pole piece under weak excitation conditions in the Foucault mode and the diffraction mode. We observe two ferromagnetic perovskite-type manganese oxides, La 0.7 Sr 0.3 MnO 3 (LSMO) and Nd 0.5 Sr 0.5 MnO 3 , in order to visualize magnetic domains and their magnetic responses to external magnetic fields. In rhombohedral-structured LSMO, pinning of magnetic domain walls at crystallographic twin boundaries was found to have a strong influence on the generation of new magnetic domains in external applied magnetic fields. © The Author 2016. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oup.com.

Development of a model using narrow slit beam profiles to account for the backscatter response of an amorphous silicon electronic portal imaging device

International Nuclear Information System (INIS)

Maria Das, K.J.; Ostapiak, Orest

2008-01-01

An electronic portal imaging device (EPID), currently used for determining proper patient placement during irradiation in a radiotherapy treatment, can also be used for the purpose of pre- treatment IMRT QA. However, the Varian aS500 portal imager exhibits dosimetric artifacts caused by non-uniform backscatter from mechanical support structures located behind the imager

Study of the local structure of binary surfaces by electron diffraction (XPS, LEED)

OpenAIRE

Gereová, Katarína

2006-01-01

Study of local structure of binary surface with usage of ultra-thin film of cerium deposited on a Pd (111) single-crystal surface is presented. X-ray photoelectron spectroscopy and diffraction (XPS, XPD), angle resolved UV photoemission spectroscopy (ARUPS) and low energy electron diffraction (LEED) was used for our investigations. LEED and X-ray excited photoemission intensities results represent a surface-geometrical structure. As well, mapping of ultra-violet photoelectron intensities as a...

Hydrogen positions in single nanocrystals revealed by electron diffraction

Czech Academy of Sciences Publication Activity Database

Palatinus, Lukáš; Brázda, Petr; Boullay, P.; Pérez, O.; Klementová, Mariana; Petit, S.; Eigner, Václav; Zaarour, M.; Mintova, S.

2017-01-01

Roč. 355, č. 6321 (2017), s. 166-169 ISSN 0036-8075 R&D Projects: GA ČR GA16-10035S; GA MŠk LO1603 EU Projects: European Commission(XE) CZ.2.16/3.1.00/24510 Institutional support: RVO:68378271 Keywords : hydrogen atoms * crystal structure * electron diffraction tomography * nanocrystalline materials Subject RIV: BM - Solid Matter Physics ; Magnetism OBOR OECD: Condensed matter physics (including formerly solid state physics, supercond.) Impact factor: 37.205, year: 2016

Diffraction and absorption of inelastically scattered electrons for K-shell ionization

International Nuclear Information System (INIS)

Josefsson, T.W.; Allen, L.J.

1995-01-01

An expression for the nonlocal inelastic scattering cross section for fast electrons in a crystalline environment, which explicitly includes diffraction as well as absorption for the inelastically scattered electrons, is used to carry out realistic calculations of K-shell electron energy loss spectroscopy (EELS) and energy dispersive x-ray (EDX) analysis cross sections. The calculations demonstrate quantitatively why, in EDX spectroscopy, integration over the dynamical states of the inelastically scattered electron averages in such a way that an effective plane wave representation of the scattered electrons is a good approximation. This is only the case for large enough acceptance angles of the detector in an EELS experiment. For EELS with smaller detector apertures, explicit integration over the dynamical final states is necessary and inclusion of absorption for the scattered electrons is important, particularly for thicker crystals. 50 refs., 7 figs

Electromagnetic backscattering from one-dimensional drifting fractal sea surface II: Electromagnetic backscattering model

International Nuclear Information System (INIS)

Xie Tao; Zhao Shang-Zhuo; Fang He; Yu Wen-Jin; He Yi-Jun; Perrie, William

2016-01-01

Sea surface current has a significant influence on electromagnetic (EM) backscattering signals and may constitute a dominant synthetic aperture radar (SAR) imaging mechanism. An effective EM backscattering model for a one-dimensional drifting fractal sea surface is presented in this paper. This model is used to simulate EM backscattering signals from the drifting sea surface. Numerical results show that ocean currents have a significant influence on EM backscattering signals from the sea surface. The normalized radar cross section (NRCS) discrepancies between the model for a coupled wave-current fractal sea surface and the model for an uncoupled fractal sea surface increase with the increase of incidence angle, as well as with increasing ocean currents. Ocean currents that are parallel to the direction of the wave can weaken the EM backscattering signal intensity, while the EM backscattering signal is intensified by ocean currents propagating oppositely to the wave direction. The model presented in this paper can be used to study the SAR imaging mechanism for a drifting sea surface. (paper)

The Correlation Characteristics of Polarization Backscattering Matrix of Dense Chaff Clouds

Directory of Open Access Journals (Sweden)

B. Tang

2018-04-01

Full Text Available This paper studied the correlation characteristics of the polarization backscattering matrix of the dense chaff cloud with uniform orientation and location distributions in circular symmetry region. Based on the theoretical analysis and numerical experiments, the correlation coefficients of the four elements in the polarization backscattering matrix are obtained, and the results indicate that the cross to co-polar correlation coefficient is still zero; and that the sum of the co-polar cross-correlation coefficient and the two times of linear depolarization ratio equals one. The results are beneficial for better understanding of the backscattering characteristics of dense chaff clouds, and are useful in the application of jamming recognition in radar electronic warfare. Numerical experiments are performed by using the method of moments.

Electron microscopy characterization of Ni-Cr-B-Si-C laser deposited coatings.

Science.gov (United States)

Hemmati, I; Rao, J C; Ocelík, V; De Hosson, J Th M

2013-02-01

During laser deposition of Ni-Cr-B-Si-C alloys with high amounts of Cr and B, various microstructures and phases can be generated from the same chemical composition that results in heterogeneous properties in the clad layer. In this study, the microstructure and phase constitution of a high-alloy Ni-Cr-B-Si-C coating deposited by laser cladding were analyzed by a combination of several microscopy characterization techniques including scanning electron microscopy in secondary and backscatter imaging modes, energy dispersive spectroscopy (EDS), electron backscatter diffraction (EBSD), and transmission electron microscopy (TEM). The combination of EDS and EBSD allowed unequivocal identification of micron-sized precipitates as polycrystalline orthorhombic CrB, single crystal tetragonal Cr5B3, and single crystal hexagonal Cr7C3. In addition, TEM characterization showed various equilibrium and metastable Ni-B, Ni-Si, and Ni-Si-B eutectic products in the alloy matrix. The findings of this study can be used to explain the phase formation reactions and to tune the microstructure of Ni-Cr-B-Si-C coatings to obtain the desired properties.

Dynamic coherent backscattering mirror

Energy Technology Data Exchange (ETDEWEB)

Zeylikovich, I.; Xu, M., E-mail: mxu@fairfield.edu [Physics Department, Fairfield University, Fairfield, CT 06824 (United States)

2016-02-15

The phase of multiply scattered light has recently attracted considerable interest. Coherent backscattering is a striking phenomenon of multiple scattered light in which the coherence of light survives multiple scattering in a random medium and is observable in the direction space as an enhancement of the intensity of backscattered light within a cone around the retroreflection direction. Reciprocity also leads to enhancement of backscattering light in the spatial space. The random medium behaves as a reciprocity mirror which robustly converts a diverging incident beam into a converging backscattering one focusing at a conjugate spot in space. Here we first analyze theoretically this coherent backscattering mirror (CBM) phenomenon and then demonstrate the capability of CBM compensating and correcting both static and dynamic phase distortions occurring along the optical path. CBM may offer novel approaches for high speed dynamic phase corrections in optical systems and find applications in sensing and navigation.

Structural study of disordered SiC nanowires by three-dimensional rotation electron diffraction

International Nuclear Information System (INIS)

Li, Duan; Guo, Peng; Wan, Wei; Zou, Ji; Shen, Zhijian; Guzi de Moraes, Elisângela; Colombo, Paolo

2014-01-01

The structure of disordered SiC nanowires was studied by using the three-dimensional rotation electron diffraction (RED) technique. The streaks shown in the RED images indicated the stacking faults of the nanowire. High-resolution transmission electron microscopy imaging was employed to support the results from the RED data. It suggested that a 2H polytype is most possible for the nanowires. (paper)

Ion beam polishing for three-dimensional electron backscattered diffraction

DEFF Research Database (Denmark)

Saowadee, Nath; Agersted, Karsten; Ubhi, H.S.

2013-01-01

averaging and/or poor 3D-EBSD data quality. In this work a low kV focused ion beam was successfully implemented to automatically polish surfaces during 3D-EBSD of La- and Nb-doped strontium titanate of volume 12.6 × 12.6 × 3.0 μm. The key to achieving this technique is the combination of a defocused low k...

Ultrafast electron diffraction and electron microscopy: present status and future prospects

International Nuclear Information System (INIS)

Ishchenko, A A; Aseyev, S A; Ryabov, E A; Bagratashvili, V N; Panchenko, V Ya

2014-01-01

Acting as complementary research tools, high time-resolved spectroscopy and diffractometry techniques proceeding from various physical principles open up new possibilities for studying matter with necessary integration of the 'structure–dynamics–function' triad in physics, chemistry, biology and materials science. Since the 1980s, a new field of research has started at the leading research laboratories, aimed at developing means of filming the coherent dynamics of nuclei in molecules and fast processes in biological objects ('atomic and molecular movies'). The utilization of ultrashort laser pulse sources has significantly modified traditional electron beam approaches to and provided high space–time resolution for the study of materials. Diffraction methods using frame-by-frame filming and the development of the main principles of the study of coherent dynamics of atoms have paved the way to observing wave packet dynamics, the intermediate states of reaction centers, and the dynamics of electrons in molecules, thus allowing a transition from the kinetics to the dynamics of the phase trajectories of molecules in the investigation of chemical reactions. (reviews of topical problems)

Diffraction efficiency of plasmonic gratings fabricated by electron beam lithography using a silver halide film

Energy Technology Data Exchange (ETDEWEB)

Sudheer,, E-mail: sudheer@rrcat.gov.in, E-mail: sudheer.rrcat@gmail.com; Tiwari, P.; Srivastava, Himanshu; Rai, V. N.; Srivastava, A. K.; Naik, P. A. [Homi Bhabha National Institute, Mumbai, Maharashtra 400094 (India); Indus Synchrotrons Utilization Division, Raja Ramanna Centre for Advanced Technology, Indore, Madhya Pradesh 452013 (India); Porwal, S. [Solid State Lasers Division, Raja Ramanna Centre for Advanced Technology, Indore, Madhya Pradesh 452013 (India); Bhartiya, S. [Homi Bhabha National Institute, Mumbai, Maharashtra 400094 (India); Laser Materials Development and Device Division, Raja Ramanna Centre for Advanced Technology, Indore, Madhya Pradesh 452013 (India); Rao, B. T. [Homi Bhabha National Institute, Mumbai, Maharashtra 400094 (India); Laser Materials Processing Division, Raja Ramanna Centre for Advanced Technology, Indore, Madhya Pradesh 452013 (India); Sharma, T. K. [Homi Bhabha National Institute, Mumbai, Maharashtra 400094 (India); Solid State Lasers Division, Raja Ramanna Centre for Advanced Technology, Indore, Madhya Pradesh 452013 (India)

2016-07-28

The silver nanoparticle surface relief gratings of ∼10 μm period are fabricated using electron beam lithography on the silver halide film substrate. Morphological characterization of the gratings shows that the period, the shape, and the relief depth in the gratings are mainly dependent on the number of lines per frame, the spot size, and the accelerating voltage of electron beam raster in the SEM. Optical absorption of the silver nanoparticle gratings provides a broad localized surface plasmon resonance peak in the visible region, whereas the intensity of the peaks depends on the number density of silver nanoparticles in the gratings. The maximum efficiency of ∼7.2% for first order diffraction is observed for the grating fabricated at 15 keV. The efficiency is peaking at 560 nm with ∼380 nm bandwidth. The measured profiles of the diffraction efficiency for the gratings are found in close agreement with the Raman-Nath diffraction theory. This technique provides a simple and efficient method for the fabrication of plasmonic nanoparticle grating structures with high diffraction efficiency having broad wavelength tuning.

Elucidating structural order and disorder phenomena in mullite-type Al{sub 4}B{sub 2}O{sub 9} by automated electron diffraction tomography

Energy Technology Data Exchange (ETDEWEB)

Zhao, Haishuang; Krysiak, Yaşar [Institute of Inorganic Chemistry and Analytical Chemistry, Jakob-Welder-Weg 11, Johannes Gutenberg-University Mainz, 55128 Mainz (Germany); Hoffmann, Kristin [Crystallography, Department of Geosciences, Klagenfurter Str. 2, GEO, University of Bremen, 28359 Bremen (Germany); Institute of Inorganic Chemistry and Crystallography, Leobener Str. NW2, University of Bremen, 28359 Bremen (Germany); Barton, Bastian [Institute of Inorganic Chemistry and Analytical Chemistry, Jakob-Welder-Weg 11, Johannes Gutenberg-University Mainz, 55128 Mainz (Germany); Molina-Luna, Leopoldo [Department of Materials and Geoscience, Technische Universität Darmstadt, Petersenstr. 23, 64287 Darmstadt (Germany); Neder, Reinhard B. [Department of Physics, Lehrstuhl für Kristallographie und Strukturphysik, Friedrich-Alexander University Erlangen-Nürnberg, Staudtstr.3, 91058 Erlangen (Germany); Kleebe, Hans-Joachim [Department of Materials and Geoscience, Technische Universität Darmstadt, Petersenstr. 23, 64287 Darmstadt (Germany); Gesing, Thorsten M. [Institute of Inorganic Chemistry and Crystallography, Leobener Str. NW2, University of Bremen, 28359 Bremen (Germany); MAPEX Center for Materials and Processes, Bibliothekstr.1, University of Bremen, 28359 Bremen (Germany); Schneider, Hartmut [Crystallography, Department of Geosciences, Klagenfurter Str. 2, GEO, University of Bremen, 28359 Bremen (Germany); Fischer, Reinhard X. [Crystallography, Department of Geosciences, Klagenfurter Str. 2, GEO, University of Bremen, 28359 Bremen (Germany); MAPEX Center for Materials and Processes, Bibliothekstr.1, University of Bremen, 28359 Bremen (Germany); and others

2017-05-15

The crystal structure and disorder phenomena of Al{sub 4}B{sub 2}O{sub 9}, an aluminum borate from the mullite-type family, were studied using automated diffraction tomography (ADT), a recently established method for collection and analysis of electron diffraction data. Al{sub 4}B{sub 2}O{sub 9}, prepared by sol-gel approach, crystallizes in the monoclinic space group C2/m. The ab initio structure determination based on three-dimensional electron diffraction data from single ordered crystals reveals that edge-connected AlO{sub 6} octahedra expanding along the b axis constitute the backbone. The ordered structure (A) was confirmed by TEM and HAADF-STEM images. Furthermore, disordered crystals with diffuse scattering along the b axis are observed. Analysis of the modulation pattern implies a mean superstructure (AAB) with a threefold b axis, where B corresponds to an A layer shifted by ½a and ½c. Diffraction patterns simulated for the AAB sequence including additional stacking disorder are in good agreement with experimental electron diffraction patterns. - Graphical abstract: Crystal structure and disorder phenomena of B-rich Al{sub 4}B{sub 2}O{sub 9} studied by automated electron diffraction tomography (ADT) and described by diffraction simulation using DISCUS. - Highlights: • Ab-initio structure solution by electron diffraction from single nanocrystals. • Detected modulation corresponding mainly to three-fold superstructure. • Diffuse diffraction streaks caused by stacking faults in disordered crystals. • Observed streaks explained by simulated electron diffraction patterns.

Electronic diffraction study of the chlorination of nickel; Etude par diffraction electronique de la chloruration du nickel

Energy Technology Data Exchange (ETDEWEB)

Vigner, D [Commissariat a l' Energie Atomique, Saclay (France). Centre d' Etudes Nucleaires

1969-07-01

A study has been made of the chlorination of the (100), (110) and (111) crystal faces of nickel using high energy electron diffraction and electron microscopy. Two methods have been used: bombardment with chlorine ions having an energy of between 10 and 30 keV, and direct chlorination in a diffractor at pressures of about 10{sup -4} torr. It has thus been possible to show the very special properties of nickel chloride (CdBr{sub 2} type, space group R 3-bar m) which is always formed along the (0001) plane, whatever the orientation of the substrate. It has also been possible to attain the metal-halide interface and to show the existence of two-dimensional chemisorbed films which are ordered or disordered according to the crystal orientation. (author) [French] La chloruration des faces (100) (110) et (111) du nickel a ete etudiee par diffraction des electrons de haute energie et par microscopie electronique. Deux methodes ont ete utilisees: le bombardement avec des ions chlore ayant une energie comprise entre 10 et 30 keV, et la chloruration directe dans un diffracteur pour des pressions de l'ordre de 10{sup -4} torr. Ainsi ont ete mises en evidence les proprietes tres particulieres du chlorure de nickel (type CdBr{sub 2}, groupe spatial R 3-bar m) qui s'accole toujours suivant le plan (0001), quelle que soit l'orientation du substrat. Il a ete egalement possible d'atteindre l'interface metal-halogenure et de montrer l'existence de couches chimisorbees bidimensionnelles, ordonnees ou desordonnees suivant l'orientation cristalline etudiee. (auteur)

In-situ studies of the recrystallization process of CuInS2 thin films by energy dispersive X-ray diffraction

International Nuclear Information System (INIS)

Thomas, D.; Mainz, R.; Rodriguez-Alvarez, H.; Marsen, B.; Abou-Ras, D.; Klaus, M.; Genzel, Ch.; Schock, H.-W.

2011-01-01

Recrystallization processes during the sulfurization of CuInS 2 (CIS) thin films have been studied in-situ using energy dispersive X-ray diffraction (EDXRD) with synchrotron radiation. In order to observe the recrystallization isolated from other reactions occurring during film growth, Cu-poor, small grained CIS layers covered with CuS on top were heated in a vacuum chamber equipped with windows for synchrotron radiation in order to analyze the grain growth mechanism within the CIS layer. In-situ monitoring of the grain size based on diffraction line profile analysis of the CIS-112 reflection was utilized to interrupt the recrystallization process at different points. Ex-situ studies by electron backscatter diffraction (EBSD) and energy dispersive X-ray spectroscopy (EDX) performed on samples of intermediate recrystallization states reveal that during the heat treatment Cu and In interdiffuse inside the layer indicating the importance of the mobility of these two elements during CuInS 2 grain growth.

Bunch evolution study in optimization of MeV ultrafast electron diffraction

International Nuclear Information System (INIS)

Lu Xianhai; Du Yingchao; Huang Wenhui; Tang Chuanxiang

2014-01-01

transverse ultrafast electron diffraction (UED) is a promising detection tool for ultrafast processes. The quality of diffraction image is determined by the transverse evolution of the probe bunch. In this paper, we study the contributing terms of the emittance and space charge effects to the bunch evolution in the MeV UED scheme, employing a mean-field model with an ellipsoidal distribution as well as particle tracking simulation. The small transverse dimension of the drive laser is found to be critical to improve the reciprocal resolution, exploiting both smaller emittance and larger transverse bunch size before the solenoid. The degradation of the reciprocal spatial resolution caused by the space charge effects should be carefully controlled. (authors)

Bunch evolution study in optimization of MeV ultrafast electron diffraction

Science.gov (United States)

Lu, Xian-Hai; Du, Ying-Chao; Huang, Wen-Hui; Tang, Chuan-Xiang

2014-12-01

Megaelectronvolt ultrafast electron diffraction (UED) is a promising detection tool for ultrafast processes. The quality of diffraction image is determined by the transverse evolution of the probe bunch. In this paper, we study the contributing terms of the emittance and space charge effects to the bunch evolution in the MeV UED scheme, employing a mean-field model with an ellipsoidal distribution as well as particle tracking simulation. The small transverse dimension of the drive laser is found to be critical to improve the reciprocal resolution, exploiting both smaller emittance and larger transverse bunch size before the solenoid. The degradation of the reciprocal spatial resolution caused by the space charge effects should be carefully controlled.

Monitoring non-pseudomorphic epitaxial growth of spinel/perovskite oxide heterostructures by reflection high-energy electron diffraction

Energy Technology Data Exchange (ETDEWEB)

Schütz, P.; Pfaff, F.; Scheiderer, P.; Sing, M.; Claessen, R. [Physikalisches Institut and Röntgen Center for Complex Material Systems (RCCM), Universität Würzburg, Am Hubland, D-97074 Würzburg (Germany)

2015-02-09

Pulsed laser deposition of spinel γ-Al{sub 2}O{sub 3} thin films on bulk perovskite SrTiO{sub 3} is monitored by high-pressure reflection high-energy electron diffraction (RHEED). The heteroepitaxial combination of two materials with different crystal structures is found to be inherently accompanied by a strong intensity modulation of bulk diffraction patterns from inelastically scattered electrons, which impedes the observation of RHEED intensity oscillations. Avoiding such electron surface-wave resonance enhancement by de-tuning the RHEED geometry allows for the separate observation of the surface-diffracted specular RHEED signal and thus the real-time monitoring of sub-unit cell two-dimensional layer-by-layer growth. Since these challenges are essentially rooted in the difference between film and substrate crystal structure, our findings are of relevance for the growth of any heterostructure combining oxides with different crystal symmetry and may thus facilitate the search for novel oxide heterointerfaces.

Characterization of gold nanoparticle films: Rutherford backscattering spectroscopy, scanning electron microscopy with image analysis, and atomic force microscopy

Directory of Open Access Journals (Sweden)

Pia C. Lansåker

2014-10-01

Full Text Available Gold nanoparticle films are of interest in several branches of science and technology, and accurate sample characterization is needed but technically demanding. We prepared such films by DC magnetron sputtering and recorded their mass thickness by Rutherford backscattering spectroscopy. The geometric thickness dg—from the substrate to the tops of the nanoparticles—was obtained by scanning electron microscopy (SEM combined with image analysis as well as by atomic force microscopy (AFM. The various techniques yielded an internally consistent characterization of the films. In particular, very similar results for dg were obtained by SEM with image analysis and by AFM.

Monte-Carlo study of the influence of backscattered electrons on the transmission of a mini-orange β spectrometer

International Nuclear Information System (INIS)

Detistov, Pavel; Balabanski, Dimiter L

2015-01-01

This work work is a part of the performance investigation of the recently constructed Mini-Orange beta spectrometer. The spectrometer has eight different configurations using three different magnet shapes and combination of three, four, and six magnet pieces allowing detection of electrons in wide kinetic energy range. The performance of the device is studied using the GEANT4 simulation tool. Evaluation of the device's basic parameters has been made, paying special attention to the backscattering, for which a study of the dependence of this process on the energy and the angle is made. (paper)

High resolution electron exit wave reconstruction from a diffraction pattern using Gaussian basis decomposition

International Nuclear Information System (INIS)

Borisenko, Konstantin B; Kirkland, Angus I

2014-01-01

We describe an algorithm to reconstruct the electron exit wave of a weak-phase object from single diffraction pattern. The algorithm uses analytic formulations describing the diffraction intensities through a representation of the object exit wave in a Gaussian basis. The reconstruction is achieved by solving an overdetermined system of non-linear equations using an easily parallelisable global multi-start search with Levenberg-Marquard optimisation and analytic derivatives

Controlled molecules for X-ray diffraction experiments at free-electron lasers

International Nuclear Information System (INIS)

Stern, Stephan

2013-12-01

X-ray diffractive imaging is at the very heart of materials science and has been utilized for decades to solve unknown molecular structures. Nowadays, it serves as the key method of structural biology to solve molecular structures of large biological molecules comprising several thousand or even millions of atoms. However, X-ray diffraction from isolated molecules is very weak. Therefore, the regular and periodic arrangement of a huge number of identical copies of a certain molecule of interest within a crystal lattice has been a necessary condition in order to exploit Bragg diffraction of X-rays. This results in a huge increase in scattered signal and a strongly improved signal-to-noise ratio compared to diffraction from non-crystalline samples. The major bottleneck of structural biology is that many of biologically interesting molecules refuse to form crystals of sufficient size to be used at synchrotron X-ray lightsources. However, novel X-ray free-electron lasers (XFELs), which became operational very recently, promise to address this issue. X-ray pulses provided by XFELs are many orders of magnitude more intense than X-ray pulses from a synchrotron source and at the same time as short as only several tens of femtoseconds. Combined with wavelengths in the nm-pm range, XFELs are well-suited to study ultrafast atomic and molecular dynamics. Additionally, the ultrashort pulses can be utilized to circumvent the damage threshold which set a limit to the incident intensity in X-ray diffraction experiments before. At XFELs, though eventually destroying the investigated sample, no significant sample deterioration happens on the ultrashort timescale of the XFEL pulse and the measured diffraction pattern is due to an (almost) unharmed sample. In the framework of this thesis, the approach of utilizing the highly intense XFEL pulses for X-ray diffraction of weakly-scattering non-crystalline samples was taken to the limit of small isolated molecules. X-ray diffraction was

Controlled molecules for X-ray diffraction experiments at free-electron lasers

Energy Technology Data Exchange (ETDEWEB)

Stern, Stephan

2013-12-15

X-ray diffractive imaging is at the very heart of materials science and has been utilized for decades to solve unknown molecular structures. Nowadays, it serves as the key method of structural biology to solve molecular structures of large biological molecules comprising several thousand or even millions of atoms. However, X-ray diffraction from isolated molecules is very weak. Therefore, the regular and periodic arrangement of a huge number of identical copies of a certain molecule of interest within a crystal lattice has been a necessary condition in order to exploit Bragg diffraction of X-rays. This results in a huge increase in scattered signal and a strongly improved signal-to-noise ratio compared to diffraction from non-crystalline samples. The major bottleneck of structural biology is that many of biologically interesting molecules refuse to form crystals of sufficient size to be used at synchrotron X-ray lightsources. However, novel X-ray free-electron lasers (XFELs), which became operational very recently, promise to address this issue. X-ray pulses provided by XFELs are many orders of magnitude more intense than X-ray pulses from a synchrotron source and at the same time as short as only several tens of femtoseconds. Combined with wavelengths in the nm-pm range, XFELs are well-suited to study ultrafast atomic and molecular dynamics. Additionally, the ultrashort pulses can be utilized to circumvent the damage threshold which set a limit to the incident intensity in X-ray diffraction experiments before. At XFELs, though eventually destroying the investigated sample, no significant sample deterioration happens on the ultrashort timescale of the XFEL pulse and the measured diffraction pattern is due to an (almost) unharmed sample. In the framework of this thesis, the approach of utilizing the highly intense XFEL pulses for X-ray diffraction of weakly-scattering non-crystalline samples was taken to the limit of small isolated molecules. X-ray diffraction was

Nickel-aluminum diffusion: A study of evolution of microstructure and phase

DEFF Research Database (Denmark)

Alimadadi, Hossein; Kjartansdóttir, Cecilía Kristín; Burrows, Andrew

2017-01-01

Microstructural and phase evolution of an aluminum deposit on nickel, after heat treatment at 883 K, is studied by means of various microscopy techniques, i.e. energy dispersive X-ray spectroscopy, backscattered electron imaging, electron backscatter diffraction, ion channeling contrast imaging...

Calculated effects of backscattering on skin dosimetry for nuclear fuel fragments

International Nuclear Information System (INIS)

Aydarous, A. Sh

2008-01-01

The size of hot particles contained in nuclear fallout ranges from 10 nm to 20 μm for the worldwide weapons fallout. Hot particles from nuclear power reactors can be significantly bigger (100 μm to several millimetres). Electron backscattering from such particles is a prominent secondary effect in beta dosimetry for radiological protection purposes, such as skin dosimetry. In this study, the effect of electron backscattering due to hot particles contamination on skin dose is investigated. These include parameters such as detector area, source radius, source energy, scattering material and source density. The Monte-Carlo Neutron Particle code (MCNP4C) was used to calculate the depth dose distribution for 10 different beta sources and various materials. The backscattering dose factors (BSDF) were then calculated. A significant dependence is shown for the BSDF magnitude upon detector area, source radius and scatterers. It is clearly shown that the BSDF increases with increasing detector area. For high Z scatterers, the BSDF can reach as high as 40 and 100% for sources with radii 0.1 and 0.0001 cm, respectively. The variation of BSDF with source radius, source energy and source density is discussed. (authors)

Quantitative convergent beam electron diffraction measurements of bonding in alumina

International Nuclear Information System (INIS)

Johnson, A.W.S.

2002-01-01

Full text: The QCBED technique of measuring accurate structure factors has been made practical by advances in energy filtering, computing and in the accurate measurement of intensity. Originally attempted in 1965 by the late Peter Goodman (CSIRO, Melbourne) while working with Gunter Lehmpfuhl (Fritz Haber Institut, Berlin), QCBED has been successfully developed and tested in the last decade on simple structures such as Si and MgO. Our work on Alumina is a step up in complexity and has shown that extinction in X-ray diffraction is not correctable to the precision required. In combination with accurate X-ray diffraction, QCBED promises to revolutionize the accuracy of bonding charge density measurements, experimental results which are of significance in the development of Density Functional Theory used in predictive chemistry. Copyright (2002) Australian Society for Electron Microscopy Inc

Interfacial orientation and misorientation relationships in nanolamellar Cu/Nb composites using transmission-electron-microscope-based orientation and phase mapping

International Nuclear Information System (INIS)

Liu, X.; Nuhfer, N.T.; Rollett, A.D.; Sinha, S.; Lee, S.-B.; Carpenter, J.S.; LeDonne, J.E.; Darbal, A.; Barmak, K.

2014-01-01

A transmission-electron-microscope-based orientation mapping technique that makes use of beam precession to achieve near-kinematical conditions was used to map the phase and crystal orientations in nanolamellar Cu/Nb composites with average layer thicknesses of 86, 30 and 18 nm. Maps of high quality and reliability were obtained by comparing the recorded diffraction patterns with pre-calculated templates. Particular care was taken in optimizing the dewarping parameters and in calibrating the frames of reference. Layers with thicknesses as low as 4 nm were successfully mapped. Heterophase interface plane and character distributions (HIPD and HICD, respectively) of Cu and Nb phases from the samples were determined from the orientation maps. In addition, local orientation relation stereograms of the Cu/Nb interfaces were calculated, and these revealed the detailed layer-to-layer texture information. The results are in agreement with previously reported neutron-diffraction-based and precession-electron-diffraction-based measurements on an accumulated roll bonding (ARB)-fabricated Cu/Nb sample with an average layer thickness of 30 nm as well as scanning-electron-microscope-based electron backscattered diffraction HIPD/HICD plots of ARB-fabricated Cu/Nb samples with layer thicknesses between 200 and 600 nm

Oscillations in the spectrum of nonlinear Thomson-backscattered radiation

Directory of Open Access Journals (Sweden)

C. A. Brau

2004-02-01

Full Text Available When an electron beam collides with a high-intensity laser beam, the spectrum of the nonlinear Thomson scattering in the backward direction shows strong oscillations like those in the spectrum of an optical klystron. Laser gain on the backward Thomson scattering is estimated using the Madey theorem, and the results suggest that Thomson-backscatter free-electron lasers are possible at wavelengths extending to the far uv using a terawatt laser beam from a chirped-pulse amplifier and a high-brightness electron beam from a needle cathode.

Can X-ray spectrum imaging replace backscattered electrons for compositional contrast in the scanning electron microscope?

Science.gov (United States)

Newbury, Dale E; Ritchie, Nicholas W M

2011-01-01

The high throughput of the silicon drift detector energy dispersive X-ray spectrometer (SDD-EDS) enables X-ray spectrum imaging (XSI) in the scanning electron microscope to be performed in frame times of 10-100 s, the typical time needed to record a high-quality backscattered electron (BSE) image. These short-duration XSIs can reveal all elements, except H, He, and Li, present as major constituents, defined as 0.1 mass fraction (10 wt%) or higher, as well as minor constituents in the range 0.01-0.1 mass fraction, depending on the particular composition and possible interferences. Although BSEs have a greater abundance by a factor of 100 compared with characteristic X-rays, the strong compositional contrast in element-specific X-ray maps enables XSI mapping to compete with BSE imaging to reveal compositional features. Differences in the fraction of the interaction volume sampled by the BSE and X-ray signals lead to more delocalization of the X-ray signal at abrupt compositional boundaries, resulting in poorer spatial resolution. Improved resolution in X-ray elemental maps occurs for the case of a small feature composed of intermediate to high atomic number elements embedded in a matrix of lower atomic number elements. XSI imaging strongly complements BSE imaging, and the SDD-EDS technology enables an efficient combined BSE-XSI measurement strategy that maximizes the compositional information. If 10 s or more are available for the measurement of an area of interest, the analyst should always record the combined BSE-XSI information to gain the advantages of both measures of compositional contrast. Copyright © 2011 Wiley Periodicals, Inc.

Quantitative analysis of Moessbauer backscatter spectra from multilayer films

International Nuclear Information System (INIS)

Bainbridge, J.

1975-01-01

The quantitative interpretation of Moessbauer backscatter spectra with particular reference to internal conversion electrons has been treated assuming that electron attenuation in a surface film can be satisfactorily described by a simple exponential law. The theory of Krakowski and Miller has been extended to include multi-layer samples, and a relation between the Moessbauer spectrum area and an individual layer thickness derived. As an example, numerical results are obtained for a duplex oxide film grown on pure iron. (Auth.)

Diffraction contrast as a sensitive indicator of femtosecond sub-nanoscale motion in ultrafast transmission electron microscopy

Science.gov (United States)

Cremons, Daniel R.; Schliep, Karl B.; Flannigan, David J.

2013-09-01

With ultrafast transmission electron microscopy (UTEM), access can be gained to the spatiotemporal scales required to directly visualize rapid, non-equilibrium structural dynamics of materials. This is achieved by operating a transmission electron microscope (TEM) in a stroboscopic pump-probe fashion by photoelectrically generating coherent, well-timed electron packets in the gun region of the TEM. These probe photoelectrons are accelerated down the TEM column where they travel through the specimen before reaching a standard, commercially-available CCD detector. A second laser pulse is used to excite (pump) the specimen in situ. Structural changes are visualized by varying the arrival time of the pump laser pulse relative to the probe electron packet at the specimen. Here, we discuss how ultrafast nanoscale motions of crystalline materials can be visualized and precisely quantified using diffraction contrast in UTEM. Because diffraction contrast sensitively depends upon both crystal lattice orientation as well as incoming electron wavevector, minor spatial/directional variations in either will produce dynamic and often complex patterns in real-space images. This is because sections of the crystalline material that satisfy the Laue conditions may be heterogeneously distributed such that electron scattering vectors vary over nanoscale regions. Thus, minor changes in either crystal grain orientation, as occurs during specimen tilting, warping, or anisotropic expansion, or in the electron wavevector result in dramatic changes in the observed diffraction contrast. In this way, dynamic contrast patterns observed in UTEM images can be used as sensitive indicators of ultrafast specimen motion. Further, these motions can be spatiotemporally mapped such that direction and amplitude can be determined.

Surface structure of Bi₂Se₃(111) determined by low-energy electron diffraction and surface x-ray diffraction

DEFF Research Database (Denmark)

dos Reis, Diogo Duarte; Barreto, Lucas; Bianchi, Marco

2013-01-01

The surface structure of the prototypical topological insulator Bi2Se3 is determined by low-energy electron diffraction and surface x-ray diffraction at room temperature. Both approaches show that the crystal is terminated by an intact quintuple layer. Specifically, an alternative termination by ...... by a bismuth bilayer is ruled out. Surface relaxations obtained by both techniques are in good agreement with each other and found to be small. This includes the relaxation of the van der Waals gap between the first two quintuple layers....

High resolution electron microscopy and electron diffraction of YBa/sub 2/Cu/sub 3/O/sub 7-x/

International Nuclear Information System (INIS)

Krakow, W.; Shaw, T.M.

1988-01-01

Experimental high resolution electron micrographs and computer simulation experiments have been used to evaluate the visibility of the atomic constituents of YBa/sub 2/Cu/sub 3/O/sub 7-x/. In practice, the detection of oxygen has not been possible in contradiction to that predicted by modelling of perfect crystalline material. Preliminary computer experiments of the electron diffraction patterns when oxygen vacancies are introduced on the Cu-O sheets separating Ba layers show the diffuse streaks characteristic of short range ordering

Electron microscopy analysis of structural changes within white etching areas

DEFF Research Database (Denmark)

Diederichs, Annika Martina; Schwedt, A.; Mayer, J.

2016-01-01

In the present work, crack networks with white etching areas (WEAs) in cross-sections of bearings were investigated by a complementary use of SEM and TEM with the focus on the use of orientation contrast imaging and electron backscatter diffraction (EBSD). Orientation contrast imaging was used...... for the first time to give detailed insight into the microstructure of WEA. A significant difference between Nital-etched and polished WEA samples was observed. It was revealed that WEAs are composed of different areas with varying grain sizes. As a result of secondary transformation, needle-shaped grains were...

Characterization of calcium crystals in Abelia using x-ray diffraction and electron microscopes

Science.gov (United States)

Localization, chemical composition, and morphology of calcium crystals in leaves and stems of Abelia mosanensis and A. ×grandiflora were analyzed with a variable pressure scanning electron microscope (VP-SEM) equipped with an X-ray diffraction system, low temperature SEM (LT-SEM) and a transmission ...

A comparison of texture results obtained using precession electron diffraction and neutron diffraction methods at diminishing length scales in ordered bimetallic nanolamellar composites

International Nuclear Information System (INIS)

Carpenter, J.S.; Liu, X.; Darbal, A.; Nuhfer, N.T.; McCabe, R.J.; Vogel, S.C.; LeDonne, J.E.; Rollett, A.D.; Barmak, K.; Beyerlein, I.J.; Mara, N.A.

2012-01-01

Precession electron diffraction (PED) is used to acquire orientation information in Cu–Nb nanolamellar composites fabricated by accumulative roll bonding (ARB). The resulting maps quantify the grain size, shape, orientation distributions and interface planes in the vicinity of nanometer-thick deformation twins. The PED-based texture results compare favorably with bulk textures provided by neutron diffraction measurements, indicating uniformity in the ARB Cu–Nb texture. Additionally, {1 1 2} Cu ||{1 1 2} Nb interfaces are present, suggesting that ARB techniques can lead to stable interfaces with a special crystallography.

A method to correct coordinate distortion in EBSD maps

International Nuclear Information System (INIS)

Zhang, Y.B.; Elbrønd, A.; Lin, F.X.

2014-01-01

Drift during electron backscatter diffraction mapping leads to coordinate distortions in resulting orientation maps, which affects, in some cases significantly, the accuracy of analysis. A method, thin plate spline, is introduced and tested to correct such coordinate distortions in the maps after the electron backscatter diffraction measurements. The accuracy of the correction as well as theoretical and practical aspects of using the thin plate spline method is discussed in detail. By comparing with other correction methods, it is shown that the thin plate spline method is most efficient to correct different local distortions in the electron backscatter diffraction maps. - Highlights: • A new method is suggested to correct nonlinear spatial distortion in EBSD maps. • The method corrects EBSD maps more precisely than presently available methods. • Errors less than 1–2 pixels are typically obtained. • Direct quantitative analysis of dynamic data are available after this correction

Circular Hough transform diffraction analysis: A software tool for automated measurement of selected area electron diffraction patterns within Digital MicrographTM

International Nuclear Information System (INIS)

Mitchell, D.R.G.

2008-01-01

A software tool (script and plugin) for computing circular Hough transforms (CHT) in Digital Micrograph TM has been developed, for the purpose of automated analysis of selected area electron diffraction patterns (SADPs) of polycrystalline materials. The CHT enables the diffraction pattern centre to be determined with sub-pixel accuracy, regardless of the exposure condition of the transmitted beam or if a beam stop is present. Radii of the diffraction rings can also be accurately measured with sub-pixel precision. If the pattern is calibrated against a known camera length, then d-spacings with an accuracy of better than 1% can be obtained. These measurements require no a priori knowledge of the pattern and very limited user interaction. The accuracy of the CHT is degraded by distortion introduced by the projector lens, and this should be minimised prior to pattern acquisition. A number of optimisations in the CHT software enable rapid processing of patterns; a typical analysis of a 1kx1k image taking just a few minutes. The CHT tool appears robust and is even able to accurately measure SADPs with very incomplete diffraction rings due to texture effects. This software tool is freely downloadable via the Internet

Low-energy electron diffraction experiment, theory and surface structure determination

CERN Document Server

Hove, Michel A; Chan, Chi-Ming

1986-01-01

Surface crystallography plays the same fundamental role in surface science which bulk crystallography has played so successfully in solid-state physics and chemistry. The atomic-scale structure is one of the most important aspects in the understanding of the behavior of surfaces in such widely diverse fields as heterogeneous catalysis, microelectronics, adhesion, lubrication, cor­ rosion, coatings, and solid-solid and solid-liquid interfaces. Low-Energy Electron Diffraction or LEED has become the prime tech­ nique used to determine atomic locations at surfaces. On one hand, LEED has yielded the most numerous and complete structural results to date (almost 200 structures), while on the other, LEED has been regarded as the "technique to beat" by a variety of other surface crystallographic methods, such as photoemission, SEXAFS, ion scattering and atomic diffraction. Although these other approaches have had impressive successes, LEED has remained the most productive technique and has shown the most versatility...

Observation of coherent optical phonons excited by femtosecond laser radiation in Sb films by ultrafast electron diffraction method

Energy Technology Data Exchange (ETDEWEB)

Mironov, B. N.; Kompanets, V. O.; Aseev, S. A., E-mail: isanfemto@yandex.ru [Russian Academy of Sciences, Institute of Spectroscopy (Russian Federation); Ischenko, A. A. [Moscow Technological University, Institute of High Chemical Technologies (Russian Federation); Kochikov, I. V. [Moscow State University (Russian Federation); Misochko, O. V. [Russian Academy of Sciences, Institute of Solid State Physics (Russian Federation); Chekalin, S. V.; Ryabov, E. A. [Russian Academy of Sciences, Institute of Spectroscopy (Russian Federation)

2017-03-15

The generation of coherent optical phonons in a polycrystalline antimony film sample has been investigated using femtosecond electron diffraction method. Phonon vibrations have been induced in the Sb sample by the main harmonic of a femtosecond Ti:Sa laser (λ = 800 nm) and probed by a pulsed ultrashort photoelectron beam synchronized with the pump laser. The diffraction patterns recorded at different times relative to the pump laser pulse display oscillations of electron diffraction intensity corresponding to the frequencies of vibrations of optical phonons: totally symmetric (A{sub 1g}) and twofold degenerate (E{sub g}) phonon modes. The frequencies that correspond to combinations of these phonon modes in the Sb sample have also been experimentally observed.

Modified Sternglass theory for the emission of secondary electrons by fast-electron impact

International Nuclear Information System (INIS)

Suszcynsky, D.M.; Borovsky, J.E.

1992-01-01

The Sternglass theory [Sternglass, Phys. Rev. 108, 1 (1957)] for fast-ion-induced secondary-electron emission from metals has been modified to predict the secondary-electron yield from metals impacted by energetic (several keV to about 200 keV) electrons. The primary modification of the theory accounts for the contribution of the backscattered electrons to the production of secondary electrons based on a knowledge of the backscattered-electron energy distribution. The modified theory is in reasonable agreement with recent experimental data from gold targets in the 6--30-keV electron energy range

Users guide to the HELIOS backscattering spectrometer (BSS)

International Nuclear Information System (INIS)

Bunce, L.J.

1986-10-01

The BSS is a backscattering spectrometer installed on the Harwell 136 Mev electron linear accelerator, HELIOS. A general description of the instrument is given, along with the time of flight scales, and the run and sample changer control units. The sample environment, vacuum system and detectors of the BSS are described, as well as the preparation, starting and running of an experiment using the BSS. (UK)

Desorption of hydrogen from magnesium hydride: in-situ electron diffraction study

International Nuclear Information System (INIS)

Paik, B.; Jones, I.P.; Walton, A.; Mann, V.; Book, D.; Harris, I.R.

2009-01-01

The dynamics of a phase change has been studied where electron beam in Transmission Electron Microscope (TEM) has been used to transform MgH 2 into magnesium. A combination of in-situ Electron Diffraction (ED) and an in-situ Electron Energy Loss Spectroscopy (EELS) study under ED mode describes the phase transformation in terms of, respectively, change in the crystal structure and Plasmon energy shift. The orientation relation [001] MgH2 //[-2110] Mg and (-110) MgH2 //(0001) Mg , obtained from the ED study, has been used to propose a model for the movements of magnesium atoms in the structural change to describe the dynamics of the process. The in-situ EELS study has been compared with the existing H-desorption model. The study aims to describe the sorption dynamics of hydrogen in MgH 2 which is a base material for a number of promising hydrogen storage systems. (author)

Ab initio structure determination and quantitative disorder analysis on nanoparticles by electron diffraction tomography.

Science.gov (United States)

Krysiak, Yaşar; Barton, Bastian; Marler, Bernd; Neder, Reinhard B; Kolb, Ute

2018-03-01

Nanoscaled porous materials such as zeolites have attracted substantial attention in industry due to their catalytic activity, and their performance in sorption and separation processes. In order to understand the properties of such materials, current research focuses increasingly on the determination of structural features beyond the averaged crystal structure. Small particle sizes, various types of disorder and intergrown structures render the description of structures at atomic level by standard crystallographic methods difficult. This paper reports the characterization of a strongly disordered zeolite structure, using a combination of electron exit-wave reconstruction, automated diffraction tomography (ADT), crystal disorder modelling and electron diffraction simulations. Zeolite beta was chosen for a proof-of-principle study of the techniques, because it consists of two different intergrown polymorphs that are built from identical layer types but with different stacking sequences. Imaging of the projected inner Coulomb potential of zeolite beta crystals shows the intergrowth of the polymorphs BEA and BEB. The structures of BEA as well as BEB could be extracted from one single ADT data set using direct methods. A ratio for BEA/BEB = 48:52 was determined by comparison of the reconstructed reciprocal space based on ADT data with simulated electron diffraction data for virtual nanocrystals, built with different ratios of BEA/BEB. In this way, it is demonstrated that this smart interplay of the above-mentioned techniques allows the elaboration of the real structures of functional materials in detail - even if they possess a severely disordered structure.

Absorptive form factors for high-energy electron diffraction

International Nuclear Information System (INIS)

Bird, D.M.; King, Q.A.

1990-01-01

The thermal diffuse scattering contribution to the absorptive potential in high-energy electron diffraction is calculated in the form of an absorptive contribution to the atomic form factor. To do this, the Einstein model of lattice vibrations is used, with isotropic Debye-Waller factors. The absorptive form factors are calculated as a function of scattering vector s and temperature factor M on a grid which enables polynomial interpolation of the results to be accurate to better than 2% for much of the ranges 0≤Ms 2 ≤6 and 0≤M≤2 A 2 . The computed values, together with an interpolation routine, have been incorporated into a Fortran subroutine which calculates both the real and absorptive form factors for 54 atomic species. (orig.)

Automated grain mapping using wide angle convergent beam electron diffraction in transmission electron microscope for nanomaterials.

Science.gov (United States)

Kumar, Vineet

2011-12-01

The grain size statistics, commonly derived from the grain map of a material sample, are important microstructure characteristics that greatly influence its properties. The grain map for nanomaterials is usually obtained manually by visual inspection of the transmission electron microscope (TEM) micrographs because automated methods do not perform satisfactorily. While the visual inspection method provides reliable results, it is a labor intensive process and is often prone to human errors. In this article, an automated grain mapping method is developed using TEM diffraction patterns. The presented method uses wide angle convergent beam diffraction in the TEM. The automated technique was applied on a platinum thin film sample to obtain the grain map and subsequently derive grain size statistics from it. The grain size statistics obtained with the automated method were found in good agreement with the visual inspection method.

Inelastic scattering of fast electrons by crystals

International Nuclear Information System (INIS)

Allen, L.J.; Josefsson, T.W.

1995-01-01

Generalized fundamental equations for electron diffraction in crystals, which include the effect of inelastic scattering described by a nonlocal interaction, are derived. An expression is obtained for the cross section for any specific type of inelastic scattering (e.g. inner-shell ionization, Rutherford backscattering). This result takes into account all other (background) inelastic scattering in the crystal leading to absorption from the dynamical Bragg-reflected beams, in practice mainly due to thermal diffuse scattering. There is a contribution to the cross section from all absorbed electrons, which form a diffuse background, as well as from the dynamical electrons. The approximations involved, assuming that the interactions leading to inelastic scattering can be described by a local potential are discussed, together with the corresponding expression for the cross section. It is demonstrated by means of an example for K-shell electron energy loss spectroscopy that nonlocal effects can be significant. 47 refs., 4 figs

A three-dimensional polarization domain retrieval method from electron diffraction data

International Nuclear Information System (INIS)

Pennington, Robert S.; Koch, Christoph T.

2015-01-01

We present an algorithm for retrieving three-dimensional domains of picometer-scale shifts in atomic positions from electron diffraction data, and apply it to simulations of ferroelectric polarization in BaTiO 3 . Our algorithm successfully and correctly retrieves polarization domains in which the Ti atom positions differ by less than 3 pm (0.4% of the unit cell diagonal distance) with 5 and 10 nm depth resolution along the beam direction, and we also retrieve unit cell strain, corresponding to tetragonal-to-cubic unit cell distortions, for 10 nm domains. Experimental applicability is also discussed. - Highlights: • We show a retrieval method for ferroelectric polarization from TEM diffraction data. • Simulated strain and polarization variations along the beam direction are retrieved. • This method can be used for 3D strain and polarization mapping without specimen tilt

The relationship between VHF radar auroral backscatter amplitude and Doppler velocity: a statistical study

Directory of Open Access Journals (Sweden)

B. A. Shand

Full Text Available A statistical investigation of the relationship between VHF radar auroral backscatter intensity and Doppler velocity has been undertaken with data collected from 8 years operation of the Wick site of the Sweden And Britain Radar-auroral Experiment (SABRE. The results indicate three different regimes within the statistical data set; firstly, for Doppler velocities <200 m s^–1, the backscatter intensity (measured in decibels remains relatively constant. Secondly, a linear relationship is observed between the backscatter intensity (in decibels and Doppler velocity for velocities between 200 m s^–1 and 700 m s^–1. At velocities greater than 700 m s^–1 the backscatter intensity saturates at a maximum value as the Doppler velocity increases. There are three possible geophysical mechanisms for the saturation in the backscatter intensity at high phase speeds: a saturation in the irregularity turbulence level, a maximisation of the scattering volume, and a modification of the local ambient electron density. There is also a difference in the dependence of the backscatter intensity on Doppler velocity for the flow towards and away from the radar. The results for flow towards the radar exhibit a consistent relationship between backscatter intensity and measured velocities throughout the solar cycle. For flow away from the radar, however, the relationship between backscatter intensity and Doppler velocity varies during the solar cycle. The geometry of the SABRE system ensures that flow towards the radar is predominantly associated with the eastward electrojet, and flow away is associated with the westward electrojet. The difference in the backscatter intensity variation as a function of Doppler velocity is attributed to asymmetries between the eastward and westward electrojets and the geophysical parameters controlling the backscatter amplitude.

The relationship between VHF radar auroral backscatter amplitude and Doppler velocity: a statistical study

Directory of Open Access Journals (Sweden)

B. A. Shand

1996-08-01

Full Text Available A statistical investigation of the relationship between VHF radar auroral backscatter intensity and Doppler velocity has been undertaken with data collected from 8 years operation of the Wick site of the Sweden And Britain Radar-auroral Experiment (SABRE. The results indicate three different regimes within the statistical data set; firstly, for Doppler velocities <200 m s–1, the backscatter intensity (measured in decibels remains relatively constant. Secondly, a linear relationship is observed between the backscatter intensity (in decibels and Doppler velocity for velocities between 200 m s–1 and 700 m s–1. At velocities greater than 700 m s–1 the backscatter intensity saturates at a maximum value as the Doppler velocity increases. There are three possible geophysical mechanisms for the saturation in the backscatter intensity at high phase speeds: a saturation in the irregularity turbulence level, a maximisation of the scattering volume, and a modification of the local ambient electron density. There is also a difference in the dependence of the backscatter intensity on Doppler velocity for the flow towards and away from the radar. The results for flow towards the radar exhibit a consistent relationship between backscatter intensity and measured velocities throughout the solar cycle. For flow away from the radar, however, the relationship between backscatter intensity and Doppler velocity varies during the solar cycle. The geometry of the SABRE system ensures that flow towards the radar is predominantly associated with the eastward electrojet, and flow away is associated with the westward electrojet. The difference in the backscatter intensity variation as a function of Doppler velocity is attributed to asymmetries between the eastward and westward electrojets and the geophysical parameters controlling the backscatter amplitude.

Diffraction structures in delta electron spectra emitted in heavy-ion atom collisions

International Nuclear Information System (INIS)

Liao, C.; Bhalla, C.; Shingal, R.; Schmidt-Boecking, H.; Shinpaugh, J.; Wolf, W.; Wolf, H.

1992-01-01

We have measured doubly differential cross sections DDCS for projectiles between F and Au and find evidence for strong diffraction structure in the Binary Encounter region of the emitted electron spectra for Au(Z=79), I(Z=53) and Cu(Z=29) projectiles, however not for F projectiles in the collision energy range between 0.2 and 0.5 MeV/u. (orig.)

Multiobjective optimizations of a novel cryocooled dc gun based ultrafast electron diffraction beam line

Directory of Open Access Journals (Sweden)

Colwyn Gulliford

2016-09-01

Full Text Available We present the results of multiobjective genetic algorithm optimizations of a single-shot ultrafast electron diffraction beam line utilizing a 225 kV dc gun with a novel cryocooled photocathode system and buncher cavity. Optimizations of the transverse projected emittance as a function of bunch charge are presented and discussed in terms of the scaling laws derived in the charge saturation limit. Additionally, optimization of the transverse coherence length as a function of final rms bunch length at the sample location have been performed for three different sample radii: 50, 100, and 200  μm, for two final bunch charges: 10^{5} electrons (16 fC and 10^{6} electrons (160 fC. Example optimal solutions are analyzed, and the effects of disordered induced heating estimated. In particular, a relative coherence length of L_{c,x}/σ_{x}=0.27  nm/μm was obtained for a final bunch charge of 10^{5} electrons and final bunch length of σ_{t}≈100  fs. For a final charge of 10^{6} electrons the cryogun produces L_{c,x}/σ_{x}≈0.1  nm/μm for σ_{t}≈100–200  fs and σ_{x}≥50  μm. These results demonstrate the viability of using genetic algorithms in the design and operation of ultrafast electron diffraction beam lines.

First indication of the coherent unipolar diffraction radiation generated by relativistic electrons

Science.gov (United States)

Naumenko, G.; Shevelev, M.

2018-05-01

As is generally known, the integral of the electric field strength over all time for usual (bipolar) radiation is zero. The first demonstration of the possibility of unipolar radiation generation has been considered theoretically by Bessonov in 1981 [E.G. Bessonov, Zh. Eksp. Teor. Fiz. 80 (1981) 852]. According to this work, the unipolar radiation (or strange electromagnetic waves) is radiation for which the integral of the electric field strength over the entire duration of a pulse differs significantly from zero. Later, several theoretical papers devoted to this phenomenon have appeared in the literature, where authors investigated mainly synchrotron radiation. However, despite the critical interest, the experimental investigations ignored this effect. In this paper we present results of the first experimental investigation of the unipolar radiation generated by a relativistic electron beam. To detect the unipolar radiation the detector that is sensitive to the selected direction of the electric field strength has been elaborated and tested. We used a designed detector to observe the coherent backward diffraction radiation appearing when a bunched electron beam travels in the vicinity of a flat conductive target. The asymmetry of the electric field strength of the coherent backward diffraction radiation has been demonstrated.

Instrumental development of a quasi-relativistic ultrashort electron beam source for electron diffractions and spectroscopies.

Science.gov (United States)

Shin, Young-Min; Figora, Michael

2017-10-01

A stable femtosecond electron beam system has been configured for time-resolved pump-probe experiments. The ultrafast electron diffraction (UED) system is designed with a sub-MeV photoelectron beam source pulsed by a femtosecond UV laser and nondispersive beamline components, including a bunch compressor-a pulsed S-band klystron is installed and fully commissioned with 5.5 MW peak power in a 2.5 μs pulse length. A single-cell RF photo-gun is designed to produce 1.6-16 pC electron bunches in a photoemission mode with 150 fs pulse duration at 0.5-1 MeV. The measured RF system jitters are within 1% in magnitude and 0.2° in phase, which would induce 3.4 keV and 0.25 keV of ΔE, corresponding to 80 fs and 5 fs of Δt, respectively. Our particle-in-cell simulations indicate that the designed bunch compressor reduces the time-of-arrival jitter by about an order of magnitude. The transport and focusing optics of the designed beamline with the bunch compressor enables an energy spread within 10 -4 and a bunch length (electron probe) within quasi-relativistic UED system.

Cryogenic EBSD reveals structure of directionally solidified ice–polymer composite

Energy Technology Data Exchange (ETDEWEB)

Donius, Amalie E., E-mail: amalie.donius@gmail.com [Thayer School of Engineering, Dartmouth College, 14 Engineering Drive, Hanover, NH 03755 (United States); Department of Materials Science and Engineering, Drexel University, 3141 Chestnut Street, Philadelphia, PA 19104 (United States); Obbard, Rachel W., E-mail: Rachel.W.Obbard@dartmouth.edu [Thayer School of Engineering, Dartmouth College, 14 Engineering Drive, Hanover, NH 03755 (United States); Burger, Joan N., E-mail: ridge.of.the.ancients@gmail.com [Thayer School of Engineering, Dartmouth College, 14 Engineering Drive, Hanover, NH 03755 (United States); Department of Materials Science and Engineering, Drexel University, 3141 Chestnut Street, Philadelphia, PA 19104 (United States); Hunger, Philipp M., E-mail: philipp.m.hunger@gmail.com [Thayer School of Engineering, Dartmouth College, 14 Engineering Drive, Hanover, NH 03755 (United States); Department of Materials Science and Engineering, Drexel University, 3141 Chestnut Street, Philadelphia, PA 19104 (United States); Baker, Ian, E-mail: Ian.Baker@dartmouth.edu [Thayer School of Engineering, Dartmouth College, 14 Engineering Drive, Hanover, NH 03755 (United States); Doherty, Roger D., E-mail: dohertrd@drexel.edu [Department of Materials Science and Engineering, Drexel University, 3141 Chestnut Street, Philadelphia, PA 19104 (United States); Wegst, Ulrike G.K., E-mail: ulrike.wegst@dartmouth.edu [Thayer School of Engineering, Dartmouth College, 14 Engineering Drive, Hanover, NH 03755 (United States)

2014-07-01

Despite considerable research efforts on directionally solidified or freeze-cast materials in recent years, little fundamental knowledge has been gained that links model with experiment. In this contribution, the cryogenic characterization of directionally solidified polymer solutions illustrates, how powerful cryo-scanning electron microscopy combined with electron backscatter diffraction is for the structural characterization of ice–polymer composite materials. Under controlled sublimation, the freeze-cast polymer scaffold structure is revealed and imaged with secondary electrons. Electron backscatter diffraction fabric analysis shows that the ice crystals, which template the polymer scaffold and create the lamellar structure, have a-axes oriented parallel to the direction of solidification and the c-axes perpendicular to it. These results indicate the great potential of both cryo-scanning electron microscopy and cryo-electron backscatter diffraction in gaining fundamental knowledge of structure–property–processing correlations. - Highlights: • Cryo-SEM of freeze-cast polymer solution reveals an ice-templated structure. • Cryo-EBSD reveals the ice crystal a-axis to parallel the solidification direction. • The honeycomb-like polymer phase favors columnar ridges only on one side. • Combining cryo-SEM with EBSD links solidification theory with experiment.

Cryogenic EBSD reveals structure of directionally solidified ice–polymer composite

International Nuclear Information System (INIS)

Donius, Amalie E.; Obbard, Rachel W.; Burger, Joan N.; Hunger, Philipp M.; Baker, Ian; Doherty, Roger D.; Wegst, Ulrike G.K.

2014-01-01

Despite considerable research efforts on directionally solidified or freeze-cast materials in recent years, little fundamental knowledge has been gained that links model with experiment. In this contribution, the cryogenic characterization of directionally solidified polymer solutions illustrates, how powerful cryo-scanning electron microscopy combined with electron backscatter diffraction is for the structural characterization of ice–polymer composite materials. Under controlled sublimation, the freeze-cast polymer scaffold structure is revealed and imaged with secondary electrons. Electron backscatter diffraction fabric analysis shows that the ice crystals, which template the polymer scaffold and create the lamellar structure, have a-axes oriented parallel to the direction of solidification and the c-axes perpendicular to it. These results indicate the great potential of both cryo-scanning electron microscopy and cryo-electron backscatter diffraction in gaining fundamental knowledge of structure–property–processing correlations. - Highlights: • Cryo-SEM of freeze-cast polymer solution reveals an ice-templated structure. • Cryo-EBSD reveals the ice crystal a-axis to parallel the solidification direction. • The honeycomb-like polymer phase favors columnar ridges only on one side. • Combining cryo-SEM with EBSD links solidification theory with experiment

Backscatter measurements for NIF ignition targets (invited).

Science.gov (United States)

Moody, J D; Datte, P; Krauter, K; Bond, E; Michel, P A; Glenzer, S H; Divol, L; Niemann, C; Suter, L; Meezan, N; MacGowan, B J; Hibbard, R; London, R; Kilkenny, J; Wallace, R; Kline, J L; Knittel, K; Frieders, G; Golick, B; Ross, G; Widmann, K; Jackson, J; Vernon, S; Clancy, T

2010-10-01

Backscattered light via laser-plasma instabilities has been measured in early NIF hohlraum experiments on two beam quads using a suite of detectors. A full aperture backscatter system and near backscatter imager (NBI) instrument separately measure the stimulated Brillouin and stimulated Raman scattered light. Both instruments work in conjunction to determine the total backscattered power to an accuracy of ∼15%. In order to achieve the power accuracy we have added time-resolution to the NBI for the first time. This capability provides a temporally resolved spatial image of the backscatter which can be viewed as a movie.

Backscatter measurements for NIF ignition targets (invited)

Energy Technology Data Exchange (ETDEWEB)

Moody, J. D.; Datte, P.; Krauter, K.; Bond, E.; Michel, P. A.; Glenzer, S. H.; Divol, L.; Suter, L.; Meezan, N.; MacGowan, B. J.; Hibbard, R.; London, R.; Kilkenny, J.; Wallace, R.; Knittel, K.; Frieders, G.; Golick, B.; Ross, G.; Widmann, K.; Jackson, J. [Lawrence Livermore National Laboratory, P.O. Box 808, Livermore, California 94550 (United States); and others

2010-10-15

Backscattered light via laser-plasma instabilities has been measured in early NIF hohlraum experiments on two beam quads using a suite of detectors. A full aperture backscatter system and near backscatter imager (NBI) instrument separately measure the stimulated Brillouin and stimulated Raman scattered light. Both instruments work in conjunction to determine the total backscattered power to an accuracy of {approx}15%. In order to achieve the power accuracy we have added time-resolution to the NBI for the first time. This capability provides a temporally resolved spatial image of the backscatter which can be viewed as a movie.

Backscatter measurements for NIF ignition targets (invited)

International Nuclear Information System (INIS)

Moody, J. D.; Datte, P.; Krauter, K.; Bond, E.; Michel, P. A.; Glenzer, S. H.; Divol, L.; Suter, L.; Meezan, N.; MacGowan, B. J.; Hibbard, R.; London, R.; Kilkenny, J.; Wallace, R.; Knittel, K.; Frieders, G.; Golick, B.; Ross, G.; Widmann, K.; Jackson, J.

2010-01-01

Backscattered light via laser-plasma instabilities has been measured in early NIF hohlraum experiments on two beam quads using a suite of detectors. A full aperture backscatter system and near backscatter imager (NBI) instrument separately measure the stimulated Brillouin and stimulated Raman scattered light. Both instruments work in conjunction to determine the total backscattered power to an accuracy of ∼15%. In order to achieve the power accuracy we have added time-resolution to the NBI for the first time. This capability provides a temporally resolved spatial image of the backscatter which can be viewed as a movie.

Microstructural characterization of IF steel after severe plastic deformation via ARB and subsequent heat treatment; Caracterizacao microestrutural de um aco IF apos deformacao plastica severa via ARB e posterior recozimento

Energy Technology Data Exchange (ETDEWEB)

Oliveira, F.C.; Abrantes, A.L.A.; Lins, J.F.C., E-mail: cristinafo2@hotmail.co [Universidade Federal Fluminense (PPGEM/UFF), Volta Redonda, RJ (Brazil). Programa de Pos-graduacao em Engenharia Metalurgica

2010-07-01

This study aimed to evaluate the microstructural evolution of a titanium stabilized IF steel deformed to warm through the ARB process for 5 consecutive cycles and then annealing at 600 deg C for 1 h. The material was characterized with the aid of the techniques of scanning electron microscopy and electron backscatter diffraction (Electron Backscatter Diffraction - EBSD). An intense process of microstructural refinement was observed in the deformed material and the phenomenon of dynamic recovery was predominant. It can be concluded that the annealing of severely deformed material was not sufficient for a complete recrystallization of the microstructure. (author)

Microstructural characterization of IF steel after severe plastic deformation via ARB and subsequent heat treatment

International Nuclear Information System (INIS)

Oliveira, F.C.; Abrantes, A.L.A.; Lins, J.F.C.

2010-01-01

This study aimed to evaluate the microstructural evolution of a titanium stabilized IF steel deformed to warm through the ARB process for 5 consecutive cycles and then annealing at 600 deg C for 1 h. The material was characterized with the aid of the techniques of scanning electron microscopy and electron backscatter diffraction (Electron Backscatter Diffraction - EBSD). An intense process of microstructural refinement was observed in the deformed material and the phenomenon of dynamic recovery was predominant. It can be concluded that the annealing of severely deformed material was not sufficient for a complete recrystallization of the microstructure. (author)

Electron Paramagnetic Resonance and X-ray Diffraction of Boron- and Phosphorus-Doped Nanodiamonds

Science.gov (United States)

Binh, Nguyen Thi Thanh; Dolmatov, V. Yu.; Lapchuk, N. M.; Shymanski, V. I.

2017-11-01

Powders of boron- and phosphorus-doped detonation nanodiamonds and sintered pellets of non-doped nanodiamond powders were studied using electron paramagnetic resonance and x-ray diffraction. Doping of detonation nanodiamond crystals with boron and phosphorus was demonstrated to be possible. These methods could be used to diagnose diamond nanocrystals doped during shock-wave synthesis.

Surface structure of VN0.89(100) determined by low-energy electron diffraction

International Nuclear Information System (INIS)

Gauthier, Y.; Joly, Y.; Rundgren, J.; Johansson, L.I.; Wincott, P.

1990-01-01

The structure of the (100) surface of substoichiometric vanadium nitride was studied by low-energy electron diffraction on a VN 0.89 (100) sample. A simple 1x1 (100) diffractogram was observed. To describe the electron scattering in substoichiometric VN we apply the averaged t-matrix approximation to the nitrogen atoms. We find that the best structural model is one having no nitrogen vacancies in the surface region. It turns out that the first layer is rippled with the N atoms displaced 0.17 A above the subplane of V atoms, that the spacing between this subplane and the second layer is 1.92 A, and that the spacing between the second and the third layer is 2.08 A. In relation to the (100) spacing of the bulk, 2.06 A, these spacings are 6.8% contracted and 1% expanded, respectively. The Debye temperature of VN is found to be 660 K in good agreement with a prediction from entropy data and from neutron diffraction and helium-ion channeling experiments

Multibeam sonar backscatter data processing

Science.gov (United States)

Schimel, Alexandre C. G.; Beaudoin, Jonathan; Parnum, Iain M.; Le Bas, Tim; Schmidt, Val; Keith, Gordon; Ierodiaconou, Daniel

2018-06-01

Multibeam sonar systems now routinely record seafloor backscatter data, which are processed into backscatter mosaics and angular responses, both of which can assist in identifying seafloor types and morphology. Those data products are obtained from the multibeam sonar raw data files through a sequence of data processing stages that follows a basic plan, but the implementation of which varies greatly between sonar systems and software. In this article, we provide a comprehensive review of this backscatter data processing chain, with a focus on the variability in the possible implementation of each processing stage. Our objective for undertaking this task is twofold: (1) to provide an overview of backscatter data processing for the consideration of the general user and (2) to provide suggestions to multibeam sonar manufacturers, software providers and the operators of these systems and software for eventually reducing the lack of control, uncertainty and variability associated with current data processing implementations and the resulting backscatter data products. One such suggestion is the adoption of a nomenclature for increasingly refined levels of processing, akin to the nomenclature adopted for satellite remote-sensing data deliverables.

Ionic liquid-based observation technique for nonconductive materials in the scanning electron microscope: Application to the characterization of a rare earth ore.

Science.gov (United States)

Brodusch, Nicolas; Waters, Kristian; Demers, Hendrix; Gauvin, Raynald

2014-03-01

A new approach for preparing geological materials is proposed to reduce charging during their characterization in a scanning electron microscope. This technique was applied to a sample of the Nechalacho rare earth deposit, which contains a significant amount of the minerals fergusonite and zircon. Instead of covering the specimen surface with a conductive coating, the sample was immersed in a dilute solution of ionic liquid and then air dried prior to SEM analysis. Imaging at a wide range of accelerating voltages was then possible without evidence of charging when using the in-chamber secondary and backscattered electrons detectors, even at 1 kV. High resolution x-ray and electron backscatter diffraction mapping were successfully obtained at 20 and 5 kV with negligible image drifting and permitted the characterization of the microstructure of the zircon/fergusonite-Y aggregates encased in the matrix minerals. Because of the absence of a conductive layer at the surface of the specimen, the Kikuchi band contrast was improved and the backscatter electron signal increased at both 5 and 20 kV as confirmed by Monte Carlo modeling. These major developments led to an improvement of the spatial resolution and efficiency of the above characterization techniques applied to the rare earth ore and it is expected that they can be applied to other types of ores and minerals. Copyright © 2014 Wiley Periodicals, Inc.

Strain mapping for the semiconductor industry by dark-field electron holography and nanobeam electron diffraction with nm resolution

International Nuclear Information System (INIS)

Cooper, David; Hartmann, Jean Michel; Carron, Veronique; Béché, Armand; Rouvière, Jean-Luc

2010-01-01

There is a requirement of the semiconductor industry to measure strain in semiconductor devices with nm-scale resolution. Here we show that dark-field electron holography and nanobeam electron diffraction (NBED) are both complementary techniques that can be used to determine the strain in these devices. We show two-dimensional strain maps acquired by dark holography and line profiles that have been acquired by NBED of recessed SiGe sources and drains with a variety of different gate lengths and Ge concentrations. We have also used dark-field electron holography to measure the evolution in strain during the silicidation process, showing that this can reduce the applied uniaxial compressive strain in the conduction channel by up to a factor of 3

A FORTRAN program for an IBM PC compatible computer for calculating kinematical electron diffraction patterns

International Nuclear Information System (INIS)

Skjerpe, P.

1989-01-01

This report describes a computer program which is useful in transmission electron microscopy. The program is written in FORTRAN and calculates kinematical electron diffraction patterns in any zone axis from a given crystal structure. Quite large unit cells, containing up to 2250 atoms, can be handled by the program. The program runs on both the Helcules graphic card and the standard IBM CGA card

Shallow water acoustic backscatter and reverberation measurements using a 68-kHz cylindrical array

Science.gov (United States)

Gallaudet, Timothy Cole

2001-10-01

The characterization of high frequency, shallow water acoustic backscatter and reverberation is important because acoustic systems are used in many scientific, commercial, and military applications. The approach taken is to use data collected by the Toroidal Volume Search Sonar (TVSS), a 68 kHz multibeam sonar capable of 360° imaging in a vertical plane perpendicular to its direction of travel. With this unique capability, acoustic backscatter imagery of the seafloor, sea surface, and horizontal and vertical planes in the volume are constructed from data obtained in 200m deep waters in the Northeastern Gulf of Mexico when the TVSS was towed 78m below the surface, 735m astern of a towship. The processed imagery provide a quasi-synoptic characterization of the spatial and temporal structure of boundary and volume acoustic backscatter and reverberation. Diffraction, element patterns, and high sidelobe levels are shown to be the most serious problems affecting cylindrical arrays such as the TVSS, and an amplitude shading method is presented for reducing the peak sidelobe levels of irregular-line and non-coplanar arrays. Errors in the towfish's attitude and motion sensor, and irregularities in the TVSS's transmitted beampattern produce artifacts in the TVSS-derived bathymetry and seafloor acoustic backscatter imagery. Correction strategies for these problems are described, which are unique in that they use environmental information extracted from both ocean boundaries. Sea surface and volume acoustic backscatter imagery are used to explore and characterize the structure of near-surface bubble clouds, schooling fish, and zooplankton. The simultaneous horizontal and vertical coverage provided by the TVSS is shown to be a primary advantage, motivating further use of multibeam sonars in these applications. Whereas boundary backscatter fluctuations are well described by Weibull, K, and Rayleigh mixture probability distributions, those corresponding to volume backscatter are

Quantitative study of Portland cement hydration by X-ray diffraction/Rietveld analysis and independent methods

International Nuclear Information System (INIS)

Scrivener, K.L.; Fuellmann, T.; Gallucci, E.; Walenta, G.; Bermejo, E.

2004-01-01

X-ray diffraction (XRD) is a powerful technique for the study of crystalline materials. The technique of Rietveld refinement now enables the amounts of different phases in anhydrous cementitious materials to be determined to a good degree of precision. This paper describes the extension of this technique to a pilot study of the hydration of a typical Portland cement. To validate this XRD-Rietveld analysis technique, its results were compared with independent measures of the same materials by the analysis of backscattered electron images (BSE/IA) and thermogravimetric analysis (TGA). In addition, the internal consistency of the measurements was studied by comparing the XRD estimates of the amounts of hydrates formed with the amounts expected to form from the XRD estimates of the amounts of anhydrous materials reacted

Measurements of transient electron density distributions by femtosecond X-ray diffraction; Messungen transienter Elektronendichteverteilungen durch Femtosekunden-Roentgenbeugung

Energy Technology Data Exchange (ETDEWEB)

Freyer, Benjamin

2013-05-02

This thesis concerns measurements of transient charge density maps by femtosecond X-ray diffraction. Different X-ray diffraction methods will be considered, particularly with regard to their application in femtosecond X-ray diffraction. The rotation method is commonly used in stationary X-ray diffraction. In the work in hand an X-ray diffraction experiment is demonstrated, which combines the method with ultrafast X-ray pulses. This experiment is the first implementation which makes use of the rotation method to map transient intensities of a multitude of Bragg reflections. As a prototype material Bismuth is used, which previously was studied frequently by femtosecond X-ray diffraction by measuring Bragg reflections successively. The experimental results of the present work are compared with the literature data. In the second part a powder-diffraction experiment will be presented, which is used to study the dynamics of the electron-density distribution on ultrafast time scales. The experiment investigates a transition metal complex after photoexcitation of the metal to ligand charge transfer state. Besides expected results, i. e. the change of the bond length between the metal and the ligand and the transfer of electronic charge from the metal to the ligand, a strong contribution of the anion to the charge transfer was found. Furthermore, the charge transfer has predominantly a cooperative character. That is, the excitation of a single complex causes an alteration of the charge density of several neighboring units. The results show that more than 30 transition-metal complexes and 60 anions contribute to the charge transfer. This collective response is a consequence of the strong coulomb interactions of the densely packed ions.

Structure and microstructure of hexagonal Ba3Ti2RuO9 by electron diffraction and microscopy

International Nuclear Information System (INIS)

Maunders, C.; Etheridge, J.; Whitfield, H.J.

2005-01-01

We have used electron microscopy and diffraction to refine the structure and investigate the microstructure of Ba 3 Ti 2 RuO 9 . The parent compound is hexagonal BaTiO 3 with the space group P6 3 /mmc. Using convergent-beam electron diffraction (CBED) combined with electron-sensitive image plates we have found that the space group of Ba 3 Ti 2 RuO 9 is the non-centrosymmetric group P6 3 mc. at room temperature and at ∝ 110 K. This is consistent with the Ru and Ti atoms occupying alternate face-sharing octahedral sites in the h0001i direction. This maintains the c-glide, but breaks the mirror normal to the c axis and consequently removes the centre of symmetry. Using powder X-ray diffraction, we have measured the lattice parameters from polycrystalline samples to be a = 5.7056 ± 0.0005, c = 14.0093 ± 0.0015 Aa at room temperature. Using high-resolution electron microscopy (HREM) we observed highly coherent, low-strain {10 anti 10} grain boundaries intersecting at 60 and 120 . From CBED we deduce that adjacent grains are identical but for the relative phase of the Ti and Ru atom ordering along the c axis. HREM also revealed occasional stacking faults, normal to the c-axis

Electron-density distribution in cubic SrTiO3: a comparative γ-ray diffraction study

International Nuclear Information System (INIS)

Jauch, W.; Reehuis, M.

2005-01-01

The electron density and atomic displacements in the perovskite SrTiO 3 have been studied using extensive and accurate γ-ray diffraction data (λ=0.0392 Aa) at room temperature. The six strongest low-order structure factors have been determined under extinction-free conditions. Gram-Charlier series expansion of the thermal parameters have revealed no evidence for anharmonicity. The population of the 3d subshell on Ti is found to be close to zero, in agreement with the observed magnetic behaviour. The electronic properties at the bond critical points indicate ionic Ti-O and Sr-O interactions of different strengths, which is corroborated by the net charges of the atomic basins [q(Sr)=1.18 vertical stroke e vertical stroke, q(Ti)=3.10 vertical stroke e vertical stroke, q(O)=1.42 vertical stroke e vertical stroke ]. A critical comparison is made with earlier experimental results from laboratory X-ray, synchrotron X-ray, electron and neutron diffraction studies. Agreement and discrepancies are identified and resolved. (orig.)

Applications of Real Space Crystallography in Characterization of Dislocations in Geological Materials in a Scanning Electron Microscope (SEM)

Science.gov (United States)

Kaboli, S.; Burnley, P. C.

2017-12-01

Imaging and characterization of defects in crystalline materials is of significant importance in various disciplines including geoscience, materials science, and applied physics. Linear defects such as dislocations and planar defects such as twins and stacking faults, strongly influence many of the properties of crystalline materials and also reflect the conditions and degree of deformation. Dislocations have been conventionally imaged in thin foils in a transmission electron microscope (TEM). Since the development of field emission scanning electron microscopes (FE-SEM) with high gun brightness and small spot size, extensive efforts have been dedicated to the imaging and characterization of dislocations in semi-conductors using electron channeling contrast imaging (ECCI) in the SEM. The obvious advantages of using SEM over TEM include easier and non-destructive sample preparation and a large field of view enabling statistical examination of the density and distribution of dislocations and other defects. In this contribution, we extend this technique to geological materials and introduce the Real Space Crystallography methodology for imaging and complete characterization of dislocations based on bend contour contrast obtained by ECCI in FE-SEM. Bend contours map out the distortion in the crystal lattice across a deformed grain. The contrast of dislocations is maximum in the vicinity of bend contours where crystal planes diffract at small and positive deviations from the Bragg positions (as defined by Bragg's law of electron diffraction). Imaging is performed in a commercial FE-SEM equipped with a standard silicon photodiode backscattered (BSE) detector and an electron backscatter diffraction (EBSD) system for crystal orientation measurements. We demonstrate the practice of this technique in characterization of a number of geological materials in particular quartz, forsterite olivine and corundum, experimentally deformed at high pressure-temperature conditions. This

Auger electron spectroscopy and Rutherford backscattering studies of copper in 2024-T3 aluminum following electrochemical anodization in phosphoric acid

Science.gov (United States)

Solomon, J. S.

1981-05-01

The effects of the electrochemical anodization of dioxidized 2024-T3 aluminum on copper were characterized by Auger electron spectroscopy and Rutherford backscattering. Anodization was performed in phosphoric acid at constant potential. Data is presented which shows that constant potential anodization of 2024-T3 is more efficient than aluminum in terms of oxide growth rates for short anodization times. However the maximum anodic oxide thickness achievable on the alloy is less than the pure metal. Copper is shown to be enriched at the oxide metal interface because of its diffusion from the bulk during anodization. The presence of copper at the oxide-metal interface is shown to affect oxide morphology.

Circular Hough transform diffraction analysis: A software tool for automated measurement of selected area electron diffraction patterns within Digital Micrograph{sup TM}

Energy Technology Data Exchange (ETDEWEB)

Mitchell, D.R.G. [Institute of Materials and Engineering Science, ANSTO, PMB 1, Menai, NSW 2234 (Australia)], E-mail: drm@ansto.gov.au

2008-03-15

A software tool (script and plugin) for computing circular Hough transforms (CHT) in Digital Micrograph{sup TM} has been developed, for the purpose of automated analysis of selected area electron diffraction patterns (SADPs) of polycrystalline materials. The CHT enables the diffraction pattern centre to be determined with sub-pixel accuracy, regardless of the exposure condition of the transmitted beam or if a beam stop is present. Radii of the diffraction rings can also be accurately measured with sub-pixel precision. If the pattern is calibrated against a known camera length, then d-spacings with an accuracy of better than 1% can be obtained. These measurements require no a priori knowledge of the pattern and very limited user interaction. The accuracy of the CHT is degraded by distortion introduced by the projector lens, and this should be minimised prior to pattern acquisition. A number of optimisations in the CHT software enable rapid processing of patterns; a typical analysis of a 1kx1k image taking just a few minutes. The CHT tool appears robust and is even able to accurately measure SADPs with very incomplete diffraction rings due to texture effects. This software tool is freely downloadable via the Internet.

Analytic representation of the backscatter correction factor at the exit of high energy photon beams

International Nuclear Information System (INIS)

Kappas, K.; Rosenwald, J.C.

1991-01-01

In high-energy X-ray beams, the dose calculated near the exit surface under electronic equilibrium conditions is generally over-estimated since it is derived from measurements performed in water with large thickness of backscattering material. The resulting error depends on a number of parameters such as beam energy, field dimension, thickness of overlying and underlying material. The authors have systematically measured for 4 different energies and for different para- meters and for different combinations of the above parameters, the reduction of dose due to backscatter. This correction is expressed as a multiplicative factor, called 'Backscatter Correction Factor' (BCF). This BCF is larger for lower energies, larger field sizes and larger depths. The BCF has been represented by an analytical expression which involves an exponential function of the backscattering thickness and linear relationships with depth field size and beam quality index. Using this expression, the BCF can be calculated within 0.5% for any conditions in the energy range investigated. (author). 14 refs.; 4 figs.; 3 tabs

A method to correct coordinate distortion in EBSD maps

DEFF Research Database (Denmark)

Zhang, Yubin; Elbrønd, Andreas Benjamin; Lin, Fengxiang

2014-01-01

Drift during electron backscatter diffraction mapping leads to coordinate distortions in resulting orientation maps, which affects, in some cases significantly, the accuracy of analysis. A method, thin plate spline, is introduced and tested to correct such coordinate distortions in the maps after...... the electron backscatter diffraction measurements. The accuracy of the correction as well as theoretical and practical aspects of using the thin plate spline method is discussed in detail. By comparing with other correction methods, it is shown that the thin plate spline method is most efficient to correct...

On a semiclassical analysis of high energy electron diffraction by imperfect crystals: the stacking fault

International Nuclear Information System (INIS)

Smith, A.E.; Chadderton, L.T.; Johnson, E.

1978-01-01

Electron diffraction amplitudes at the lower surface of a displaced sandwich crystal are obtained for the high energy limit in the real space formulation. Using semiclassical methods analytical approximations to a resulting overlap integral - central to the problem - are derived. (Auth.)

Direct observation of the formation of silver precipitations by means of electron diffraction

International Nuclear Information System (INIS)

Benz, V.; Ostwald, R.; Weil, K.G.

1976-01-01

Thin films (20-1,000 A) of copper (I)-, silver, and lead(II)-halides were prepared by evaporation onto silver (III), gold (III), and PbTe (III)-surfaces. These films were irradiated in vacuo with 40 kV-electrons, in some cases also with the light of a Xenon-lamp. At the same time the diffraction pattern, produced by the electron beam at glancing incidence, was observed and registered photographically. Silver precipitates could be detected by their diffraction pattern, when the crystallites had grown to a size of about 50 A. From all materials investigated silveriodide showed maximum sensitivity. The precipitates formed show no orientation with respect to the host crystal. From the temperature dependence of the sensitivity an activation energy of 0.12 eV can be deduced leading to interstitial ion migration as rate determining step. Pure silverchloride can not been radiolyzed by 40 kV-electrons. After doping it with 0.3 mol% CaCl 2 or MgCl 2 it becomes very sensitive. The precipitate showes orientation with respect to the host lattice. Also pure CuJ is resistant against the electron beam. Mixed crystals (Ag, Cu)J with xsub(AgJ) > 0.5 behave similar as pure AgJ. Pb(II)-halides show no sensitivity, but the compounds AgBr x 2 PbBr 2 and 5 AgJ x PbJ 2 are readily radiolyzed, forming polycrystalline silver precipitates. The mechanism of radiolysis, its dependency on temperature and film thickness is discussed. (orig.) [de

Lines of Evidence–Incremental Markings in Molar Enamel of Soay Sheep as Revealed by a Fluorochrome Labeling and Backscattered Electron Imaging Study

Science.gov (United States)

Kierdorf, Horst; Kierdorf, Uwe; Frölich, Kai; Witzel, Carsten

2013-01-01

We studied the structural characteristics and periodicities of regular incremental markings in sheep enamel using fluorochrome injections for vital labeling of forming enamel and backscattered electron imaging in the scanning electron microscope. Microscopic analysis of mandibular first molars revealed the presence of incremental markings with a daily periodicity (laminations) that indicated successive positions of the forming front of interprismatic enamel. In addition to the laminations, incremental markings with a sub-daily periodicity were discernible both in interprismatic enamel and in enamel prisms. Five sub-daily increments were present between two consecutive laminations. Backscattered electron imaging revealed that each sub-daily growth increment consisted of a broader and more highly mineralized band and a narrower and less mineralized band (line). The sub-daily markings in the prisms of sheep enamel morphologically resembled the (daily) prisms cross striations seen in primate enamel. Incremental markings with a supra-daily periodicity were not observed in sheep enamel. Based on the periodicity of the incremental markings, maximum mean daily apposition rates of 17.0 µm in buccal enamel and of 13.4 µm in lingual enamel were recorded. Enamel extension rates were also high, with maximum means of 180 µm/day and 217 µm/day in upper crown areas of buccal and lingual enamel, respectively. Values in more cervical crown portions were markedly lower. Our results are in accordance with previous findings in other ungulate species. Using the incremental markings present in primate enamel as a reference could result in a misinterpretation of the incremental markings in ungulate enamel. Thus, the sub-daily growth increments in the prisms of ungulate enamel might be mistaken as prism cross striations with a daily periodicity, and the laminations misidentified as striae of Retzius with a supra-daily periodicity. This would lead to a considerable overestimation of

Ultrafast electron diffraction from non-equilibrium phonons in femtosecond laser heated Au films

Energy Technology Data Exchange (ETDEWEB)

Chase, T. [Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, California 94025 (United States); Department of Applied Physics, Stanford University, Stanford, California 94305 (United States); Trigo, M.; Reid, A. H.; Dürr, H. A. [Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, California 94025 (United States); Li, R.; Vecchione, T.; Shen, X.; Weathersby, S.; Coffee, R.; Hartmann, N.; Wang, X. J. [SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, California 94025 (United States); Reis, D. A. [Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, California 94025 (United States); Department of Applied Physics, Stanford University, Stanford, California 94305 (United States); PULSE Institute, SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, California 94025 (United States)

2016-01-25

We use ultrafast electron diffraction to detect the temporal evolution of non-equilibrium phonons in femtosecond laser-excited ultrathin single-crystalline gold films. From the time-dependence of the Debye-Waller factor, we extract a 4.7 ps time-constant for the increase in mean-square atomic displacements. The observed increase in the diffuse scattering intensity demonstrates that the energy transfer from laser-heated electrons to phonon modes near the X and K points in the Au fcc Brillouin zone proceeds with timescales of 2.3 and 2.9 ps, respectively, faster than the Debye-Waller average mean-square displacement.

Pulse shape and spectrum of coherent diffraction-limited transition radiation from electron beams

Energy Technology Data Exchange (ETDEWEB)

van Tilborg, J.; Schroeder, C.B.; Esarey, E.; Leemans, W.P.

2003-12-20

The electric field in the temporal and spectral domain of coherent diffraction-limited transition radiation is studied. An electron bunch, with arbitrary longitudinal momentum distribution, propagating at normal incidence to a sharp metal-vacuum boundary with finite transverse dimension is considered. A general expression for the spatiotemporal electric field of the transition radiation is derived, and closed-form solutions for several special cases are given. The influence of parameters such as radial boundary size, electron momentum distribution, and angle of observation on the waveform (e.g., radiation pulse length and amplitude) are discussed. For a Gaussian electron bunch, the coherent radiation waveform is shown to have a single-cycle profile. Application to a novel THz source based on a laser-driven accelerator is discussed.

Investigation of electronic order using resonant soft X-ray diffraction

Energy Technology Data Exchange (ETDEWEB)

Schlappa, J.

2006-12-01

The aim of this PhD work was the application of resonant soft X-ray diffraction technique for the investigation of electronic order in transition metal oxides at the TM L{sub 2,3}-edge, trying to obtain a quantitative understanding of the data. The method was first systematically explored through application to a model system in order to test the feasibility of the technique and to understand of how X-ray optical effects have to be taken into account. Two more complex systems were investigated; stripe order in La{sub 1.8}Sr{sub 0.2}NiO{sub 4} and charge and orbital order in Fe{sub 3}O{sub 4}. The main focus of the work was on the spectroscopic potential of the technique, trying to obtain a level of quantitative description of the data. For X-ray absorption spectroscopy (XAS) from transition metal oxides, cluster configuration interaction calculation provides a powerful and realistic microscopic theory. In the frame work of this thesis cluster theory, considering explicit hybridization effects between the TM-ion and the surrounding oxygen ligands, has been applied for the first time to describe resonant diffraction data. (orig.)

Investigation of electronic order using resonant soft X-ray diffraction

International Nuclear Information System (INIS)

Schlappa, J.

2006-01-01

The aim of this PhD work was the application of resonant soft X-ray diffraction technique for the investigation of electronic order in transition metal oxides at the TM L 2,3 -edge, trying to obtain a quantitative understanding of the data. The method was first systematically explored through application to a model system in order to test the feasibility of the technique and to understand of how X-ray optical effects have to be taken into account. Two more complex systems were investigated; stripe order in La 1.8 Sr 0.2 NiO 4 and charge and orbital order in Fe 3 O 4 . The main focus of the work was on the spectroscopic potential of the technique, trying to obtain a level of quantitative description of the data. For X-ray absorption spectroscopy (XAS) from transition metal oxides, cluster configuration interaction calculation provides a powerful and realistic microscopic theory. In the frame work of this thesis cluster theory, considering explicit hybridization effects between the TM-ion and the surrounding oxygen ligands, has been applied for the first time to describe resonant diffraction data. (orig.)

Ultrafast coherent diffractive imaging of nanoparticles using X-ray free-electron laser radiation

International Nuclear Information System (INIS)

Kassemeyer, Stephan

2014-01-01

Coherent diffractive imaging with X-ray free-electron lasers (X-FEL) promises high-resolution structure determination of single microscopic particles without the need for crystallization. The diffraction signal of small samples can be very weak, a difficulty that can not be countered by merely increasing the number of photons because the sample would be damaged by a high absorbed radiation dose. Traditional X-ray crystallography avoids this problem by bringing many sample particles into a periodic arrangement, which amplifies the individual signals while distributing the absorbed dose. Depending on the sample, however, crystallization can be very difficult or even impossible. This thesis presents algorithms for a new imaging approach using X-FEL radiation that works with single, non-crystalline sample particles. X-FELs can deliver X-rays with a peak brilliance many orders of magnitude higher than conventional X-ray sources, compensating for their weak interaction cross sections. At the same time, FELs can produce ultra-short pulses down to a few femtoseconds. In this way it is possible to perform ultra-fast imaging, essentially ''freezing'' the atomic positions in time and terminating the imaging process before the sample is destroyed by the absorbed radiation. This thesis primarily focuses on the three-dimensional reconstruction of single (and not necessarily crystalline) particles using coherent diffractive imaging at X-FELs: in order to extract three-dimensional information from scattering data, two-dimensional diffraction patterns from many different viewing angles must be combined. Therefore, the diffraction signal of many identical sample copies in random orientations is measured. The main result of this work is a globally optimal algorithm that can recover the sample orientations solely based on the diffraction signal, enabling three-dimensional imaging for arbitrary samples. The problem of finding three-dimensional orientations is

Correlated microradiography, X-ray microbeam diffraction and electron probe microanalysis of calcifications in an odontoma

International Nuclear Information System (INIS)

Aoba, T.; Yoshioka, C.; Yagi, T.

1980-01-01

Using microradiography, X-ray microbeam diffraction and electron probe microanalysis, a correlated morphologic and crystallographic study was performed on dysplastic enamel in a compound odontoma. The tumor was found in the lateral incisor-canine region of the left mandible of a 36-year-old woman. A conspicuous feature was the presence of hypomineralized areas, which were situated in the proximity of enamel surface and distinctly demarcated from the adjacent enamel. X-ray microbeam diffraction and electron microanalysis showed that these lesions have a lower crystallinity and a higher concentration of magnesium as compared with the adjacent enamel. In addition, the present study revealed the presence of two other types of calcifications: 1) calcified structures within the fissure or on the enamel surface, which include lacunae of varying size and which resemble a form of coronal cementum, and 2) spherical calcifications which may be an epithelial product. (author)

Molecular structure determination of cyclooctane by Ab Initio and electron diffraction methods in the gas phase

International Nuclear Information System (INIS)

Almeida, Wagner B. de

2000-01-01

The determination of the molecular structure of molecules is of fundamental importance in chemistry. X-rays and electron diffraction methods constitute in important tools for the elucidation of the molecular structure of systems in the solid state and gas phase, respectively. The use of quantum mechanical molecular orbital ab initio methods offer an alternative for conformational analysis studies. Comparison between theoretical results and those obtained experimentally in the gas phase can make a significant contribution for an unambiguous determination of the geometrical parameters. In this article the determination for an unambiguous determination of the geometrical parameters. In this article the determination of the molecular structure of the cyclooctane molecule by electron diffraction in the gas phase an initio calculations will be addressed, providing an example of a comparative analysis of theoretical and experimental predictions. (author)

Spatially coded backscatter radiography

International Nuclear Information System (INIS)

Thangavelu, S.; Hussein, E.M.A.

2007-01-01

Conventional radiography requires access to two opposite sides of an object, which makes it unsuitable for the inspection of extended and/or thick structures (airframes, bridges, floors etc.). Backscatter imaging can overcome this problem, but the indications obtained are difficult to interpret. This paper applies the coded aperture technique to gamma-ray backscatter-radiography in order to enhance the detectability of flaws. This spatial coding method involves the positioning of a mask with closed and open holes to selectively permit or block the passage of radiation. The obtained coded-aperture indications are then mathematically decoded to detect the presence of anomalies. Indications obtained from Monte Carlo calculations were utilized in this work to simulate radiation scattering measurements. These simulated measurements were used to investigate the applicability of this technique to the detection of flaws by backscatter radiography

Strong-Field Modulated Diffraction Effects in the Correlated Electron-Nuclear Motion in Dissociating H2+

International Nuclear Information System (INIS)

He Feng; Becker, Andreas; Thumm, Uwe

2008-01-01

We show that the electronic dynamics in a molecule driven by a strong field is complex and potentially even counterintuitive. As a prototype example, we simulate the interaction of a dissociating H 2 + molecule with an intense infrared laser pulse. Depending on the laser intensity, the direction of the electron's motion between the two nuclei is found to follow or oppose the classical laser-electric force. We explain the sensitive dependence of the correlated electronic-nuclear motion in terms of the diffracting electronic momentum distribution of the dissociating two-center system. The distribution is dynamically modulated by the nuclear motion and periodically shifted in the oscillating infrared electric field

X-ray backscatter imaging for radiography by selective detection and snapshot: Evolution, development, and optimization

Science.gov (United States)

Shedlock, Daniel

Compton backscatter imaging (CBI) is a single-sided imaging technique that uses the penetrating power of radiation and unique interaction properties of radiation with matter to image subsurface features. CBI has a variety of applications that include non-destructive interrogation, medical imaging, security and military applications. Radiography by selective detection (RSD), lateral migration radiography (LMR) and shadow aperture backscatter radiography (SABR) are different CBI techniques that are being optimized and developed. Radiography by selective detection (RSD) is a pencil beam Compton backscatter imaging technique that falls between highly collimated and uncollimated techniques. Radiography by selective detection uses a combination of single- and multiple-scatter photons from a projected area below a collimation plane to generate an image. As a result, the image has a combination of first- and multiple-scatter components. RSD techniques offer greater subsurface resolution than uncollimated techniques, at speeds at least an order of magnitude faster than highly collimated techniques. RSD scanning systems have evolved from a prototype into near market-ready scanning devices for use in a variety of single-sided imaging applications. The design has changed to incorporate state-of-the-art detectors and electronics optimized for backscatter imaging with an emphasis on versatility, efficiency and speed. The RSD system has become more stable, about 4 times faster, and 60% lighter while maintaining or improving image quality and contrast over the past 3 years. A new snapshot backscatter radiography (SBR) CBI technique, shadow aperture backscatter radiography (SABR), has been developed from concept and proof-of-principle to a functional laboratory prototype. SABR radiography uses digital detection media and shaded aperture configurations to generate near-surface Compton backscatter images without scanning, similar to how transmission radiographs are taken. Finally, a

Molecular structure of tetramethylgermane from gas electron diffraction

Science.gov (United States)

Csákvári, Éva; Rozsondai, Béla; Hargittai, István

1991-05-01

The molecular structure of Ge(CH 3) 4 has been determined from gas-phase electron diffraction augmented by a normal coordinate analysis. Assuming tetrahedral symmetry for the germanium bond configuration, the following structural parameters are found: rg(GeC) = 1.958 ± 0.004 Å, rg(CH) = 1.111 ± 0.003 Å and ∠(GeCH) = 110.7 ± 0.2° ( R=4.0%). The methyl torsional barrier V 0 is estimated to be 1.3 kJ mol -1 on the basis of an effective angle of torsion 23.0 ± 1.5°, from the staggered form, yielded directly by the analysis. The GeC bond length of Ge(CH 3) 4 is the same, within experimental error, as that of Ge(C 6H 5) 4 and is in agreement with the prediction of a modified Schomaker-Stevenson relationship.

Novel radio-frequency gun structures for ultrafast relativistic electron diffraction.

Science.gov (United States)

Musumeci, P; Faillace, L; Fukasawa, A; Moody, J T; O'Shea, B; Rosenzweig, J B; Scoby, C M

2009-08-01

Radio-frequency (RF) photoinjector-based relativistic ultrafast electron diffraction (UED) is a promising new technique that has the potential to probe structural changes at the atomic scale with sub-100 fs temporal resolution in a single shot. We analyze the limitations on the temporal and spatial resolution of this technique considering the operating parameters of a standard 1.6 cell RF gun (which is the RF photoinjector used for the first experimental tests of relativistic UED at Stanford Linear Accelerator Center; University of California, Los Angeles; Brookhaven National Laboratory), and study the possibility of employing novel RF structures to circumvent some of these limits.

LEED (Low Energy Electron Diffraction)

International Nuclear Information System (INIS)

Aberdam, M.

1973-01-01

The various types of systems studied by LEED, and for which the geometry of diffraction patterns is exploited, are reviewed, intensity profiles being another source of information. Two representative approaches of the scattering phenomenon are examined; the band structure theory and the T matrix approach [fr

Calculation of diffraction patterns associated with electron irradiation induced amorphization of CuTi

International Nuclear Information System (INIS)

Devanathan, R.; Meshii, M.; Sabochik, M.J.

1990-11-01

A new approach that uses the multislice method in conjunction with molecular dynamics simulations to study electron irradiation induced amorphisation is presented. Diffraction patterns were calculated for CuTi and found to be more sensitive than the pair correlation function to the structural changes preceding amorphisation. The results from this approach and from a study of long range order are presented. 16 refs., 8 figs

Recommendations for processing atmospheric attenuated backscatter profiles from Vaisala CL31 ceilometers

Science.gov (United States)

Kotthaus, Simone; O'Connor, Ewan; Münkel, Christoph; Charlton-Perez, Cristina; Haeffelin, Martial; Gabey, Andrew M.; Grimmond, C. Sue B.

2016-08-01

Ceilometer lidars are used for cloud base height detection, to probe aerosol layers in the atmosphere (e.g. detection of elevated layers of Saharan dust or volcanic ash), and to examine boundary layer dynamics. Sensor optics and acquisition algorithms can strongly influence the observed attenuated backscatter profiles; therefore, physical interpretation of the profiles requires careful application of corrections. This study addresses the widely deployed Vaisala CL31 ceilometer. Attenuated backscatter profiles are studied to evaluate the impact of both the hardware generation and firmware version. In response to this work and discussion within the CL31/TOPROF user community (TOPROF, European COST Action aiming to harmonise ground-based remote sensing networks across Europe), Vaisala released new firmware (versions 1.72 and 2.03) for the CL31 sensors. These firmware versions are tested against previous versions, showing that several artificial features introduced by the data processing have been removed. Hence, it is recommended to use this recent firmware for analysing attenuated backscatter profiles. To allow for consistent processing of historic data, correction procedures have been developed that account for artefacts detected in data collected with older firmware. Furthermore, a procedure is proposed to determine and account for the instrument-related background signal from electronic and optical components. This is necessary for using attenuated backscatter observations from any CL31 ceilometer. Recommendations are made for the processing of attenuated backscatter observed with Vaisala CL31 sensors, including the estimation of noise which is not provided in the standard CL31 output. After taking these aspects into account, attenuated backscatter profiles from Vaisala CL31 ceilometers are considered capable of providing valuable information for a range of applications including atmospheric boundary layer studies, detection of elevated aerosol layers, and model

A study on displacement of crystalline diffraction peaks in electron-beam irradiated filter paper cellulose

International Nuclear Information System (INIS)

Zhou Ruimin; Xiang Qun; Song Jing

1997-01-01

It is found that the crystalline diffraction angles of the electron-beam irradiated filter paper cellulose shift regularly when the irradiation dose is increased. The experiments indicate that the molecules between crystalline area and amorphous area in the filter paper cellulose will be degraded by the irradiation and the cellulose molecules in the surface of crystal will come off, thus the microcrystalline dimension will be reduced and the diffraction angle will become smaller. The fact that intensity of the 002 peak for filter paper samples decreases gradually with the increasing storage time can be attributed to the post-irradiation effect

A digital instrument for nondestructive measurements of coating thicknesses by beta backscattering

Science.gov (United States)

Farcasiu, D. M.; Apostolescu, T.; Bozdog, H.; Badescu, E.; Bohm, V.; Stanescu, S. P.; Jianu, A.; Bordeanu, C.; Cracium, M. V.

1992-02-01

The elements of nondestructive gauging of coatings applied on various metal bases are presented. The intensity of the backscattered beta radiations is related to the thickness of the coating. With a fixed measuring geometry and radioactive sources (147Pm, 204Tl, 90Sr+90Y) the intensity of the backscattered beta particles is dependent on the following parameters: coating thickness, atomic number of the coating material and of the base, the beta particle energy and the surface finish. It can be used for the measurement of a wide range of coating thicknesses provided that the difference between the coating and the support atomic numbers is at least 20%. Fields of application include electronics, electrotechnique and so on.

A digital instrument for nondestructive measurements of coating thicknesses by beta backscattering

International Nuclear Information System (INIS)

Farcasiu, D.M.; Apostolescu, T.; Bozdog, H.; Badescu, E.; Bohm, V.; Stanescu, S.P.; Jianu, A.; Bordeanu, C.; Craciun, M.V.

1992-01-01

The elements of nondestructive gauging of coatings applied on various metal bases are presented. The intensity of the backscattered beta radiations is related to the thickness of the coating. With a fixed measuring geometry and radioactive sources ( 147 Pm, 204 Tl, 90 Sr+ 90 Y) the intensity of the backscattered beta particles is dependent on the following parameters: Coating thickness, atomic number of the coating material and of the base, the beta particle energy and the surface finish. It can be used for the measurement of a wide range of coating thicknesses provided that the difference between the coating and the support atomic numbers is at least 20%. Fields of application include electronics, electrotechnique and so on. (orig.)

Integral staggered point-matching method for millimeter-wave reflective diffraction gratings on electron cyclotron heating systems

International Nuclear Information System (INIS)

Xia, Donghui; Huang, Mei; Wang, Zhijiang; Zhang, Feng; Zhuang, Ge

2016-01-01

Highlights: • The integral staggered point-matching method for design of polarizers on the ECH systems is presented. • The availability of the integral staggered point-matching method is checked by numerical calculations. • Two polarizers are designed with the integral staggered point-matching method and the experimental results are given. - Abstract: The reflective diffraction gratings are widely used in the high power electron cyclotron heating systems for polarization strategy. This paper presents a method which we call “the integral staggered point-matching method” for design of reflective diffraction gratings. This method is based on the integral point-matching method. However, it effectively removes the convergence problems and tedious calculations of the integral point-matching method, making it easier to be used for a beginner. A code is developed based on this method. The calculation results of the integral staggered point-matching method are compared with the integral point-matching method, the coordinate transformation method and the low power measurement results. It indicates that the integral staggered point-matching method can be used as an optional method for the design of reflective diffraction gratings in electron cyclotron heating systems.

Integral staggered point-matching method for millimeter-wave reflective diffraction gratings on electron cyclotron heating systems

Energy Technology Data Exchange (ETDEWEB)

Xia, Donghui [State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Huazhong University of Science and Technology, 430074 Wuhan (China); Huang, Mei [Southwestern Institute of Physics, 610041 Chengdu (China); Wang, Zhijiang, E-mail: wangzj@hust.edu.cn [State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Huazhong University of Science and Technology, 430074 Wuhan (China); Zhang, Feng [Southwestern Institute of Physics, 610041 Chengdu (China); Zhuang, Ge [State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Huazhong University of Science and Technology, 430074 Wuhan (China)

2016-10-15

Highlights: • The integral staggered point-matching method for design of polarizers on the ECH systems is presented. • The availability of the integral staggered point-matching method is checked by numerical calculations. • Two polarizers are designed with the integral staggered point-matching method and the experimental results are given. - Abstract: The reflective diffraction gratings are widely used in the high power electron cyclotron heating systems for polarization strategy. This paper presents a method which we call “the integral staggered point-matching method” for design of reflective diffraction gratings. This method is based on the integral point-matching method. However, it effectively removes the convergence problems and tedious calculations of the integral point-matching method, making it easier to be used for a beginner. A code is developed based on this method. The calculation results of the integral staggered point-matching method are compared with the integral point-matching method, the coordinate transformation method and the low power measurement results. It indicates that the integral staggered point-matching method can be used as an optional method for the design of reflective diffraction gratings in electron cyclotron heating systems.

Three-dimensional nanostructure determination from a large diffraction data set recorded using scanning electron nanodiffraction

Directory of Open Access Journals (Sweden)

Yifei Meng

2016-09-01

Full Text Available A diffraction-based technique is developed for the determination of three-dimensional nanostructures. The technique employs high-resolution and low-dose scanning electron nanodiffraction (SEND to acquire three-dimensional diffraction patterns, with the help of a special sample holder for large-angle rotation. Grains are identified in three-dimensional space based on crystal orientation and on reconstructed dark-field images from the recorded diffraction patterns. Application to a nanocrystalline TiN thin film shows that the three-dimensional morphology of columnar TiN grains of tens of nanometres in diameter can be reconstructed using an algebraic iterative algorithm under specified prior conditions, together with their crystallographic orientations. The principles can be extended to multiphase nanocrystalline materials as well. Thus, the tomographic SEND technique provides an effective and adaptive way of determining three-dimensional nanostructures.

Reassessment of the electron density in Cu2O using γ-ray diffraction.

Science.gov (United States)

Jauch, Wolfgang; Reehuis, Manfred

2014-12-01

The electron-density distribution in Cu2O has been critically reexamined to test controversial conclusions from earlier experimental and theoretical studies. The electron density is derived via multipole refinement of high-quality single-crystal diffraction data, collected at room temperature with 316.5 keV gamma radiation. Four γ-lines in the energy range 200-600 keV have been used to extrapolate extinction-free low-order structure factors. The remaining extinction corrections refine to a crystal mosaicity identical to the observed one. There is no support for anharmonic contributions to the thermal parameters. Important features of the derived electron density are (i) a partially filled d_{z^2} orbital, (ii) an incomplete ionization of Cu and O, and (iii) no interstitial Cu-Cu charge pileup, thereby refuting the covalent bonding hypothesis.

ESCA and electron diffraction studies of InP surface heated under As molecular beam exposure

International Nuclear Information System (INIS)

Sugiura, Hideo; Yamaguchi, Masafumi; Shibukawa, Atsushi

1983-01-01

Chemical composition of InP substrate surface heattreated under As molecular beam exposure in an ultrahigh vacuum chamber was studied with ESCA, and surface reconstruction of the substrate was examined by in-situ electron diffraction. The InP substrate heated under the exposure of As molecular beam has mirror surface up to 590 0 C while the surface of InP heated above 400 0 C in vacuum is roughened. The ESCA study shows that thin InAs layer (thickness 0 C under the exposure of As. The electron diffraction study indicates that the InP is cleaned at about 500 0 C in As pressures of 10 -7 - 10 -5 Torr. The InP surface is prevented from thermally decomposing by the coverage of the InAs layer, which may be formed through the following process: 2InPO 4 + As 4 → 2InAs + P 2 O 5 + As 2 O 3 . (author)

Electron-density distribution in cubic SrTiO{sub 3}: a comparative {gamma}-ray diffraction study

Energy Technology Data Exchange (ETDEWEB)

Jauch, W. [Hahn-Meitner-Inst., Berlin (Germany); Reehuis, M. [Max-Planck-Institut fuer Festkoerperforschung, Stuttgart (Germany)

2005-07-01

The electron density and atomic displacements in the perovskite SrTiO{sub 3} have been studied using extensive and accurate {gamma}-ray diffraction data ({lambda}=0.0392 Aa) at room temperature. The six strongest low-order structure factors have been determined under extinction-free conditions. Gram-Charlier series expansion of the thermal parameters have revealed no evidence for anharmonicity. The population of the 3d subshell on Ti is found to be close to zero, in agreement with the observed magnetic behaviour. The electronic properties at the bond critical points indicate ionic Ti-O and Sr-O interactions of different strengths, which is corroborated by the net charges of the atomic basins [q(Sr)=1.18 vertical stroke e vertical stroke, q(Ti)=3.10 vertical stroke e vertical stroke, q(O)=1.42 vertical stroke e vertical stroke ]. A critical comparison is made with earlier experimental results from laboratory X-ray, synchrotron X-ray, electron and neutron diffraction studies. Agreement and discrepancies are identified and resolved. (orig.)

THE DECISION OF FORM FOR DIFFRACTIVE STRUCTURES IN THE PROBLEM OF SCATTERING OF RADIO WAVES.

Directory of Open Access Journals (Sweden)

A. P. Preobrazhensky

2017-02-01

Full Text Available This paper considers the problem of scattering of electromagnetic waves in different diffraction structures. The solution of the scattering problem is based on the method of integral equations. On diagrams of backscattering at various frequencies of the incident wave, the decision about the form of the object is carried out.

Study of Deformation Phenomena in TRIP/TWIP Steels by Acoustic Emission and Scanning Electron Microscopy

Science.gov (United States)

Linderov, M. L.; Segel, C.; Weidner, A.; Biermann, H.; Vinogradov, A. Yu.

2018-04-01

Modern metastable steels with TRIP/TWIP effects have a unique set of physical-mechanical properties. They combine both high-strength and high-plasticity characteristics, which is governed by processes activated during deformation, namely, twinning, the formation of stacking faults, and martensitic transformations. To study the behavior of these phenomena in CrMnNi TRIP/TWIP steels and stainless CrNiMo steel, which does not have these effects in the temperature range under study, we used the method of acoustic emission and modern methods of signal processing, including the cluster analysis of spectral-density functions. The results of this study have been compared with a detailed microstructural analysis performed with a scanning electron microscope using electron backscatter diffraction (EBSD).

User expectations for multibeam echo sounders backscatter strength data-looking back into the future

Science.gov (United States)

Lucieer, Vanessa; Roche, Marc; Degrendele, Koen; Malik, Mashkoor; Dolan, Margaret; Lamarche, Geoffroy

2018-06-01

With the ability of multibeam echo sounders (MBES) to measure backscatter strength (BS) as a function of true angle of insonification across the seafloor, came a new recognition of the potential of backscatter measurements to remotely characterize the properties of the seafloor. Advances in transducer design, digital electronics, signal processing capabilities, navigation, and graphic display devices, have improved the resolution and particularly the dynamic range available to sonar and processing software manufacturers. Alongside these improvements the expectations of what the data can deliver has also grown. In this paper, we identify these user-expectations and explore how MBES backscatter is utilized by different communities involved in marine seabed research at present, and the aspirations that these communities have for the data in the future. The results presented here are based on a user survey conducted by the GeoHab (Marine Geological and Biological Habitat Mapping) association. This paper summarises the different processing procedures employed to extract useful information from MBES backscatter data and the various intentions for which the user community collect the data. We show how a range of backscatter output products are generated from the different processing procedures, and how these results are taken up by different scientific disciplines, and also identify common constraints in handling MBES BS data. Finally, we outline our expectations for the future of this unique and important data source for seafloor mapping and characterisation.

The Use of Backscattered Electron Imaging and Transmission Electron Microscopy to Assess Bone Architecture and Mineral Loci: Effect of Intermittent Slow-Release Sodium Fluoride Therapy

Science.gov (United States)

Zerwekh, Joseph E.; Bellotto, Dennis; Prostak, Kenneth S.; Hagler, Herbert K.; Pak, Charles Y. C.

1996-04-01

Backscattered electron imaging (BEI) and transmission electron microscopy (TEM) were used to examine the effects of treatment with intermittent slow-release sodium fluoride (SRNaF) and continuous calcium citrate on bone architecture and crystallinity. Examination was performed in nondecalcified biopsies obtained from patients following up to four years of therapy (placebo or SRNaF) and compared to pretreatment biopsies from each patient, as well as to bone from young, normal subjects. BEI images disclosed increased areas of recent bone formation following fluoride administration. There was no evidence of a mineralization defect in any biopsy and both cortical and trabecular architecture remained normal. TEM analysis demonstrated intrafibrillar platelike crystals and extrafibrillar needlelike crystals for both the pre- and post-treatment biopsies as well as for the bone from young normal subjects. There was no evidence of increased crystal size or of an increase in extrafibrillar mineral deposition. These observations suggest that intermittent SRNaF and continuous calcium therapy exerts an anabolic action on the skeleton not accompanied by a mineralization defect or an alteration of bone mineral deposition. The use of BEI and TEM holds promise for the study of the pathophysiology and treatment of metabolic bone diseases.

Microscopic residual stress evolution during deformation process of an Fe---Mn---Si---Cr shape memory alloy investigated using white X-ray microbeam diffraction

International Nuclear Information System (INIS)

Kwon, E.P.; Sato, S.; Fujieda, S.; Shinoda, K.; Kajiwara, K.; Sato, M.; Suzuki, S.

2013-01-01

Microscopic residual stress evolution in different austenite (γ) grains during shape memory process in an Fe---Mn---Si---Cr alloy was investigated using the white X-ray microbeam diffraction technique. The use of high-energy white X-ray microbeam with small beam size allowed us to measure the microscopic residual stress in coarse γ grains with specific orientation. After tensile deformation large compressive residual stress was evolved in γ grains due to the formation of stress-induced ε martensite, but upon recovery heating it almost disappeared as a result of reverse transformation of martensite. The magnitude of compressive residual stress was higher in grains with orientations close to 〈144〉 and 〈233〉 orientations than in a grain with near 〈001〉 orientation. Analysis of the microstructure of each grain using electron backscattering diffraction suggested that the difference in the magnitude of compressive residual stress could be attributed to different martensitic transformation characteristics in the grains

Assessing the grain structure of highly X-ray absorbing metallic alloys

Energy Technology Data Exchange (ETDEWEB)

Bormann, Therese [Basel Univ. (Switzerland). Biomaterials Science Center; University of Applied Sciences Northwestern Switzerland, Muttenz (Switzerland). Inst. for Medical and Analytical Technologies; Beckmann, Felix [Helmholtz-Zentrum Geesthacht (Germany). Inst. of Materials Research; Schinhammer, Michael [Eidgenoessische Technische Hochschule (ETH), Zuerich (Switzerland). Dept. of Materials; Deyhle, Hans; Mueller, Bert [Basel Univ. (Switzerland). Biomaterials Science Center; Wild, Michael de [University of Applied Sciences Northwestern Switzerland, Muttenz (Switzerland). Inst. for Medical and Analytical Technologies

2014-07-15

Selective laser melting allows the fabrication of NiTi implants with pre-defined, complex shapes. The control of the process parameters regulates the arrangement of the granular microstructure of the NiTi alloy. We prepared specimens with elongated grains, which build a sound basis for diffraction contrast tomography experiments using synchrotron radiation and for electron backscatter diffraction measurements. Both approaches reveal the orientation and size of the individual grains within the specimen. Still, electron backscatter diffraction is confined to two-dimensional cross-sections while diffraction contrast tomography reveals these microstructural features in three dimensions. We demonstrate that the grains in the selective laser melted specimen, which are oriented along the building direction, do not exhibit a well-defined planar grain orientation but are twisted. These twisted grains give rise to diffraction spots observable for several degrees of specimen rotation simultaneously to the acquisition of tomography data. (orig.)

Characterization of oxidation protection coatings for high temperature applications by means of nanoindentation and scanning electron microscopy methods; Charakterisierung von Oxidationsschutzschichten fuer Hochtemperaturanwendungen mittels Nanoindentierung und rasterelektronenmikroskopischen Methoden

Energy Technology Data Exchange (ETDEWEB)

Webler, R.; Neumeier, S.; Goeken, M. [Erlangen-Nuernberg Univ., Erlangen (Germany). Lehrstuhl fuer Allgemeine Werkstoffeigenschaften

2014-10-01

Oxidation protection coatings are required for thermally highly stressed components such as turbine blades in aircraft engines. Cyclic oxidation experiments were performed on a NiCoCrAlY protective coating of a nickel-based superalloy and hardness and modulus of elasticity (mechanical properties) were determined by nanoindentation before and after the experiments. Microstructure and chemical composition were characterized by means of scanning electron microscopy. Here, the focus is on the phase identification by combining electron backscatter diffraction and energy dispersive X-ray spectroscopy. Findings indicate that the chemical composition strongly influences the mechanical properties.

Study of electron-beam-evaporated MgO films using electron diffraction, optical absorption and cathodoluminescence

Energy Technology Data Exchange (ETDEWEB)

Aboelfotoh, M.O.; Ramsey, J.N.

1982-05-21

Reflection high energy electron diffraction, optical absorption and cathodoluminescence were used to study MgO films deposited onto fused silica, single-crystal silicon and LiF substrates at various temperatures. Results showed that some of the same optical absorption and emission bands observed in X- or UV-irradiated, additively colored or mechanically deformed MgO crystals were observed in evaporated MgO films. The peak positions and the relative peak intensities of the optical absorption and emission bands depended on the substrate temperature during film deposition as well as on the structure of the film. The effect of heating the films in air and vacuum on the optical absorption and emission bands is also discussed.

Transition to turbulence via spatiotemporal intermittency in stimulated Raman backscattering

International Nuclear Information System (INIS)

Skoric, M.M.; Jovanovic, M.S.; Rajkovic, M.R.

1996-01-01

The spatiotemporal evolution of stimulated Raman backscattering in a bounded, uniform, weakly dissipative plasma is studied. The nonlinear model of a three-wave interaction involves a quadratic coupling of slowly varying complex amplitudes of the laser pump, the backscattered and the electron plasma wave. The corresponding set of coupled partial differential equations with nonlinear phase detuning that is taken into account is solved numerically in space time with fixed nonzero source boundary conditions. The study of the above open, convective, weakly confined system reveals a quasiperiodic transition to spatiotemporal chaos via spatiotemporal intermittency. In the analysis of transitions a dual scheme borrowed from fields of nonlinear dynamics and statistical physics is applied. An introduction of a nonlinear three-wave interaction to a growing family of paradigmatic equations which exhibit a route to turbulence via spatiotemporal intermittency is outlined in this work. copyright 1996 The American Physical Society

Orientation and phase mapping in the transmission electron microscope using precession-assisted diffraction spot recognition: state-of-the-art results.

Science.gov (United States)

Viladot, D; Véron, M; Gemmi, M; Peiró, F; Portillo, J; Estradé, S; Mendoza, J; Llorca-Isern, N; Nicolopoulos, S

2013-10-01

A recently developed technique based on the transmission electron microscope, which makes use of electron beam precession together with spot diffraction pattern recognition now offers the possibility to acquire reliable orientation/phase maps with a spatial resolution down to 2 nm on a field emission gun transmission electron microscope. The technique may be described as precession-assisted crystal orientation mapping in the transmission electron microscope, precession-assisted crystal orientation mapping technique-transmission electron microscope, also known by its product name, ASTAR, and consists in scanning the precessed electron beam in nanoprobe mode over the specimen area, thus producing a collection of precession electron diffraction spot patterns, to be thereafter indexed automatically through template matching. We present a review on several application examples relative to the characterization of microstructure/microtexture of nanocrystalline metals, ceramics, nanoparticles, minerals and organics. The strengths and limitations of the technique are also discussed using several application examples. ©2013 The Authors. Journal of Microscopy published by John Wiley & Sons Ltd on behalf of Royal Microscopical Society.

Analysis of improvement in performance and design parameters for enhancing resolution in an atmospheric scanning electron microscope.

Science.gov (United States)

Yoon, Yeo Hun; Kim, Seung Jae; Kim, Dong Hwan

2015-12-01

The scanning electron microscope is used in various fields to go beyond diffraction limits of the optical microscope. However, the electron pathway should be conducted in a vacuum so as not to scatter electrons. The pretreatment of the sample is needed for use in the vacuum. To directly observe large and fully hydrophilic samples without pretreatment, the atmospheric scanning electron microscope (ASEM) is needed. We developed an electron filter unit and an electron detector unit for implementation of the ASEM. The key of the electron filter unit is that electrons are transmitted while air molecules remain untransmitted through the unit. The electron detector unit collected the backscattered electrons. We conducted experiments using the selected materials with Havar foil, carbon film and SiN film. © The Author 2015. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oup.com.

Digital diffractive optics: Have diffractive optics entered mainstream industry yet?

Science.gov (United States)

Kress, Bernard; Hejmadi, Vic

2010-05-01

When a new technology is integrated into industry commodity products and consumer electronic devices, and sold worldwide in retail stores, it is usually understood that this technology has then entered the realm of mainstream technology and therefore mainstream industry. Such a leap however does not come cheap, as it has a double edge sword effect: first it becomes democratized and thus massively developed by numerous companies for various applications, but also it becomes a commodity, and thus gets under tremendous pressure to cut down its production and integration costs while not sacrificing to performance. We will show, based on numerous examples extracted from recent industry history, that the field of Diffractive Optics is about to undergo such a major transformation. Such a move has many impacts on all facets of digital diffractive optics technology, from the optical design houses to the micro-optics foundries (for both mastering and volume replication), to the final product integrators or contract manufacturers. The main causes of such a transformation are, as they have been for many other technologies in industry, successive technological bubbles which have carried and lifted up diffractive optics technology within the last decades. These various technological bubbles have been triggered either by real industry needs or by virtual investment hype. Both of these causes will be discussed in the paper. The adjective ""digital"" in "digital diffractive optics" does not refer only, as it is done in digital electronics, to the digital functionality of the element (digital signal processing), but rather to the digital way they are designed (by a digital computer) and fabricated (as wafer level optics using digital masking techniques). However, we can still trace a very strong similarity between the emergence of micro-electronics from analog electronics half a century ago, and the emergence of digital optics from conventional optics today.

Backscatter dose from metallic materials due to obliquely incident high-energy photon beams

International Nuclear Information System (INIS)

Nadrowitz, Roger; Feyerabend, Thomas

2001-01-01

If metallic material is exposed to ionizing radiation of sufficient high energy, an increase in dose due to backscatter radiation occurs in front of this material. Our purpose in this study was to quantify these doses at variable distances between scattering materials and the detector at axial beam angles between 0 deg. (zero angle in beams eye view) and 90 deg. . Copper, silver and lead sheets embedded in a phantom of perspex were exposed to 10 MV-bremsstrahlung. The detector we developed is based on the fluorescence property of pyromellitic acid (1,2,4,5 benzenetetracarboxylic acid) after exposure to ionizing radiation. Our results show that the additional doses and the corresponding dose distribution in front of the scattering materials depend quantitatively and qualitatively on the beam angle. The backscatter dose increases with varying beam angle from 0 deg. to 90 deg. up to a maximum at 55 deg. for copper and silver. At angles of 0 deg. and 55 deg. the integral backscatter doses over a tissue-equivalent depth of 2 mm are 11.2% and 21.6% for copper and 24% and 28% for silver, respectively. In contrast, in front of lead there are no obvious differences of the measured backscatter doses at angles between 0 deg. and 55 deg. With a further increase of the beam angle from 55 deg. to 90 deg. the backscatter dose decreases steeply for all three materials. In front of copper a markedly lower penetrating depth of the backscattered electrons was found for an angle of 0 deg. compared to 55 deg. This dependence from the beam angle was less pronounced in front of silver and not detectable in front of lead. In conclusion, the dependence of the backscatter dose from the angle between axial beam and scattering material must be considered, as higher scattering doses have to be considered than previously expected. This may have a clinical impact since the surface of metallic implants is usually curved

Backscatter dose from metallic materials due to obliquely incident high-energy photon beams

Energy Technology Data Exchange (ETDEWEB)

Nadrowitz, Roger; Feyerabend, Thomas [Medical University of Luebeck, Germany, Department of Radiotherapy and Nuclear Medicine, Ratzeburger Allee 160, Luebeck, D-23538 (Germany)

2001-06-01

If metallic material is exposed to ionizing radiation of sufficient high energy, an increase in dose due to backscatter radiation occurs in front of this material. Our purpose in this study was to quantify these doses at variable distances between scattering materials and the detector at axial beam angles between 0 deg. (zero angle in beams eye view) and 90 deg. . Copper, silver and lead sheets embedded in a phantom of perspex were exposed to 10 MV-bremsstrahlung. The detector we developed is based on the fluorescence property of pyromellitic acid (1,2,4,5 benzenetetracarboxylic acid) after exposure to ionizing radiation. Our results show that the additional doses and the corresponding dose distribution in front of the scattering materials depend quantitatively and qualitatively on the beam angle. The backscatter dose increases with varying beam angle from 0 deg. to 90 deg. up to a maximum at 55 deg. for copper and silver. At angles of 0 deg. and 55 deg. the integral backscatter doses over a tissue-equivalent depth of 2 mm are 11.2% and 21.6% for copper and 24% and 28% for silver, respectively. In contrast, in front of lead there are no obvious differences of the measured backscatter doses at angles between 0 deg. and 55 deg. With a further increase of the beam angle from 55 deg. to 90 deg. the backscatter dose decreases steeply for all three materials. In front of copper a markedly lower penetrating depth of the backscattered electrons was found for an angle of 0 deg. compared to 55 deg. This dependence from the beam angle was less pronounced in front of silver and not detectable in front of lead. In conclusion, the dependence of the backscatter dose from the angle between axial beam and scattering material must be considered, as higher scattering doses have to be considered than previously expected. This may have a clinical impact since the surface of metallic implants is usually curved.

Three-dimensional structure determination protocol for noncrystalline biomolecules using x-ray free-electron laser diffraction imaging.

Science.gov (United States)

Oroguchi, Tomotaka; Nakasako, Masayoshi

2013-02-01

Coherent and intense x-ray pulses generated by x-ray free-electron laser (XFEL) sources are paving the way for structural determination of noncrystalline biomolecules. However, due to the small scattering cross section of electrons for x rays, the available incident x-ray intensity of XFEL sources, which is currently in the range of 10(12)-10(13) photons/μm(2)/pulse, is lower than that necessary to perform single-molecule diffraction experiments for noncrystalline biomolecules even with the molecular masses of megadalton and submicrometer dimensions. Here, we propose an experimental protocol and analysis method for visualizing the structure of those biomolecules by the combined application of coherent x-ray diffraction imaging and three-dimensional reconstruction methods. To compensate the small scattering cross section of biomolecules, in our protocol, a thin vitreous ice plate containing several hundred biomolecules/μm(2) is used as sample, a setup similar to that utilized by single-molecule cryoelectron microscopy. The scattering cross section of such an ice plate is far larger than that of a single particle. The images of biomolecules contained within irradiated areas are then retrieved from each diffraction pattern, and finally provide the three-dimensional electron density model. A realistic atomic simulation using large-scale computations proposed that the three-dimensional structure determination of the 50S ribosomal subunit embedded in a vitreous ice plate is possible at a resolution of 0.8 nm when an x-ray beam of 10(16) photons/500×500 nm(2)/pulse is available.

Measurement of back-scattered radiation from micro multileaf collimator into the beam monitor chamber from a dual energy linear accelerator

Directory of Open Access Journals (Sweden)

Muralidhar K

2007-01-01

Full Text Available Measurements designed to find the collimator backscatter into the beam monitor chamber from Micro Multileaf collimator of 6 MV photon beams of the Siemens Primus linear accelerator were made with the help of dose rate feedback control. The photons and electrons backscattered from the upper and lower secondary collimator jaws give rise to a significant increase in the ion charge measured by monitor chamber. This increase varies between the different accelerators. The output measurements were carried out in air at the isocenter. The effect of collimator backscatter was investigated by measuring the pulse width, number of beam pulses per monitor unit, monitor unit rate and dose for different mMLC openings. These measurements were made with and without dose rate feedback control, i.e., with constant electron beam current in the accelerator. Monitor unit rate (MU/min was almost constant for all field sizes. The maximum variation between the open and the closed feedback control circuits was 2.5%. There was no difference in pulse width and negligible difference in pulse frequency. Maximum value of backscattered radiation from the micro Multileaf collimator into the beam monitor chamber was found to be 0.5%.

Electron-lattice energy relaxation in laser-excited thin-film Au-insulator heterostructures studied by ultrafast MeV electron diffraction.

Science.gov (United States)

Sokolowski-Tinten, K; Shen, X; Zheng, Q; Chase, T; Coffee, R; Jerman, M; Li, R K; Ligges, M; Makasyuk, I; Mo, M; Reid, A H; Rethfeld, B; Vecchione, T; Weathersby, S P; Dürr, H A; Wang, X J

2017-09-01

We apply time-resolved MeV electron diffraction to study the electron-lattice energy relaxation in thin film Au-insulator heterostructures. Through precise measurements of the transient Debye-Waller-factor, the mean-square atomic displacement is directly determined, which allows to quantitatively follow the temporal evolution of the lattice temperature after short pulse laser excitation. Data obtained over an extended range of laser fluences reveal an increased relaxation rate when the film thickness is reduced or the Au-film is capped with an additional insulator top-layer. This behavior is attributed to a cross-interfacial coupling of excited electrons in the Au film to phonons in the adjacent insulator layer(s). Analysis of the data using the two-temperature-model taking explicitly into account the additional energy loss at the interface(s) allows to deduce the relative strength of the two relaxation channels.

Quasimonochromatic x-rays generated from nonlinear Thomson backscattering

International Nuclear Information System (INIS)

Lan Pengfei; Lu Peixiang; Cao Wei; Wang Xinlin

2007-01-01

The nonlinear Thomson backscattering in a circularly polarized Gaussian laser pulse is investigated and spectral characteristics of the emission are discussed. It is indicated that the frequency of the emitted light is up-shifted by the nonlinear doppler effect. By using a properly focused laser beam or putting the electron before the focus, the variety of the nonlinear Doppler shift during the interaction can be minimized and quasimonochromatic x-rays are generated. Taking into account the emission power, the optimum situations for generating quasimonochromatic x-rays are explored

Quantum-chemical calculations and electron diffraction study of the equilibrium molecular structure of vitamin K3

Science.gov (United States)

Khaikin, L. S.; Tikhonov, D. S.; Grikina, O. E.; Rykov, A. N.; Stepanov, N. F.

2014-05-01

The equilibrium molecular structure of 2-methyl-1,4-naphthoquinone (vitamin K3) having C s symmetry is experimentally characterized for the first time by means of gas-phase electron diffraction using quantum-chemical calculations and data on the vibrational spectra of related compounds.

Characterisation of the incident beam and current diffraction capabilities on the VESUVIO spectrometer

Science.gov (United States)

Romanelli, G.; Krzystyniak, M.; Senesi, R.; Raspino, D.; Boxall, J.; Pooley, D.; Moorby, S.; Schooneveld, E.; Rhodes, N. J.; Andreani, C.; Fernandez-Alonso, F.

2017-09-01

The VESUVIO spectrometer at the ISIS pulsed neutron and muon source is a unique instrument amongst those available at neutron facilities. This is the only inverted-geometry neutron spectrometer accessing values of energy and wavevector transfer above tens of eV and {\\mathringA}-1 , respectively, and where deep inelastic neutron scattering experiments are routinely performed. As such, the procedure at the base of the technique has been previously described in an article published by this journal (Mayers and Reiter 2012 Meas. Sci. Technol. 23 045902). The instrument has recently witnessed an upsurge of interest due to a new trend to accommodate, within a single experiment, neutron diffraction and transmission measurements in addition to deep inelastic neutron scattering. This work presents a broader description of the instrument following these recent developments. In particular, we assess the absolute intensity and two-dimensional profile of the incident neutron beam and the capabilities of the backscattering diffraction banks. All results are discussed in the light of recent changes to the moderator viewed by the instrument. We find that VESUVIO has to be considered a high-resolution diffractometer as much as other diffractometers at ISIS, with a resolution as high as 2× 10-3 in backscattering. Also, we describe the extension of the wavelength range of the instrument to include lower neutron energies for diffraction measurements, an upgrade that could be readily applied to other neutron instruments as well.

Relating P-band AIRSAR backscatter to forest stand parameters

Science.gov (United States)

Wang, Yong; Melack, John M.; Davis, Frank W.; Kasischke, Eric S.; Christensen, Norman L., Jr.

1993-01-01

As part of research on forest ecosystems, the Jet Propulsion Laboratory (JPL) and collaborating research teams have conducted multi-season airborne synthetic aperture radar (AIRSAR) experiments in three forest ecosystems including temperate pine forest (Duke, Forest, North Carolina), boreal forest (Bonanza Creek Experimental Forest, Alaska), and northern mixed hardwood-conifer forest (Michigan Biological Station, Michigan). The major research goals were to improve understanding of the relationships between radar backscatter and phenological variables (e.g. stand density, tree size, etc.), to improve radar backscatter models of tree canopy properties, and to develop a radar-based scheme for monitoring forest phenological changes. In September 1989, AIRSAR backscatter data were acquired over the Duke Forest. As the aboveground biomass of the loblolly pine forest stands at Duke Forest increased, the SAR backscatter at C-, L-, and P-bands increased and saturated at different biomass levels for the C-band, L-band, and P-band data. We only use the P-band backscatter data and ground measurements here to study the relationships between the backscatter and stand density, the backscatter and mean trunk dbh (diameter at breast height) of trees in the stands, and the backscatter and stand basal area.

Analytical Electron Diffraction from Iii-V and II-Vi Semiconductors

Science.gov (United States)

Spellward, Paul

Available from UMI in association with The British Library. This thesis describes the development and evaluation of a number of new TEM-based techniques for the measurement of composition in ternary III-V and II-VI semiconductors. New methods of polarity determination in binary and ternary compounds are also presented. The theory of high energy electron diffraction is outlined, with particular emphasis on zone axis diffraction from well-defined strings. An account of TEM microstructural studies of Cd_{rm x}Hg _{rm 1-x}Te and CdTe epitaxial layers, which provided the impetus for developing the diffraction-based analytical techniques, is given. The wide range of TEM-based compositional determination techniques is described. The use of HOLZ deficiency lines to infer composition from a lattice parameter measurement is evaluated. In the case of Cd_{ rm x}Hg_{rm 1-x}Te, it is found to be inferior to other techniques developed. Studies of dynamical aspects of HOLZ diffraction can yield information about the dispersion surface from which a measure of composition may be obtained. This technique is evaluated for Al_{rm x}Ga_{rm 1-x} As, in which it is found to be of some use, and for Cd_{rm x}Hg _{rm 1-x}Te, in which the large Debye-Waller factor associated with mercury in discovered to render the method of little value. A number of critical voltages may be measured in medium voltage TEMs. The (111) zone axis critical voltage of Cd_{rm x}Hg _{rm 1-x}Te is found to vary significantly with x and forms the basis of an accurate technique for composition measurement in that ternary compound. Other critical voltage phenomena are investigated. In Al _{rm x}Ga_ {rm 1-x}As and other light ternaries, a non-systematic critical voltage is found to vary with x, providing a good indicator of composition. Critical voltage measurements may be made by conventional CBED or by various other techniques, which may also simultaneously yield information on the spatial variation of composition. The

On the Use of Dynamical Diffraction Theory To Refine Crystal Structure from Electron Diffraction Data: Application to KLa5O5(VO4)2, a Material with Promising Luminescent Properties.

Science.gov (United States)

Colmont, Marie; Palatinus, Lukas; Huvé, Marielle; Kabbour, Houria; Saitzek, Sébastien; Djelal, Nora; Roussel, Pascal

2016-03-07

A new lanthanum oxide, KLa5O5(VO4)2, was synthesized using a flux growth technique that involved solid-state reaction under an air atmosphere at 900 °C. The crystal structure was solved and refined using an innovative approach recently established and based on three-dimensional (3D) electron diffraction data, using precession of the electron beam and then validated against Rietveld refinement and denisty functional theory (DFT) calculations. It crystallizes in a monoclinic unit cell with space group C2/m and has unit cell parameters of a = 20.2282(14) Å, b = 5.8639(4) Å, c = 12.6060(9) Å, and β = 117.64(1)°. Its structure is built on Cresnel-like two-dimensional (2D) units (La5O5) of 4*3 (OLa4) tetrahedra, which run parallel to (001) plane, being surrounded by isolated VO4 tetrahedra. Four isolated vanadate groups create channels that host K(+) ions. Substitution of K(+) cations by another alkali metal is possible, going from lithium to rubidium. Li substitution led to a similar phase with a primitive monoclinic unit cell. A complementary selected area electron diffraction (SAED) study highlighted diffuse streaks associated with stacking faults observed on high-resolution electron microscopy (HREM) images of the lithium compound. Finally, preliminary catalytic tests for ethanol oxidation are reported, as well as luminescence evidence. This paper also describes how solid-state chemists can take advantages of recent progresses in electron crystallography, assisted by DFT calculations and powder X-ray diffraction (PXRD) refinements, to propose new structural types with potential applications to the physicist community.

Development of an ellipse fitting method with which to analyse selected area electron diffraction patterns

Energy Technology Data Exchange (ETDEWEB)

Mitchell, D.R.G., E-mail: dmitchel@uow.edu.au [Electron Microscopy Centre, Australian Institute for Innovative Materials, Innovation Campus, University of Wollongong, North Wollongong, NSW 2500 (Australia); Van den Berg, J.A. [Electron Microscopy Centre, Australian Institute for Innovative Materials, Innovation Campus, University of Wollongong, North Wollongong, NSW 2500 (Australia); Catalyst Fundamentals, Fischer-Tropsch and Syngas Conversion Research, Sasol Technology R & D, Sasolburg 1947 (South Africa)

2016-01-15

A software method has been developed which uses ellipse fitting to analyse electron diffraction patterns from polycrystalline materials. The method, which requires minimal user input, can determine the pattern centre and the diameter of diffraction rings with sub-pixel precision. This enables accurate crystallographic information to be obtained in a rapid and consistent manner. Since the method fits ellipses, it can detect, quantify and correct any elliptical distortion introduced by the imaging system. Distortion information derived from polycrystalline patterns as a function of camera length can be subsequently recalled and applied to single crystal patterns, resulting in improved precision and accuracy. The method has been implemented as a plugin for the DigitalMicrograph software by Gatan, and is a freely available via the internet. - Highlights: • A robust ellipse fitting method is developed. • Freely available software for automated diffraction pattern analysis is demonstrated. • Measurement and correction of elliptical distortion is routinely achieved.

Development of positron diffraction and holography at LLNL

International Nuclear Information System (INIS)

Hamza, A.; Asoka-Kumar, P.; Stoeffl, W.; Howell, R.; Miller, D.; Denison, A.

2003-01-01

A low-energy positron diffraction and holography spectrometer is currently being constructed at the Lawrence Livermore National Laboratory (LLNL) to study surfaces and adsorbed structures. This instrument will operate in conjunction with the LLNL intense positron beam produced by the 100 MeV LINAC allowing data to be acquired in minutes rather than days. Positron diffraction possesses certain advantages over electron diffraction which are discussed. Details of the instrument based on that of low-energy electron diffraction are described

Secondary electron emission from metals and semi-conductor compounds

International Nuclear Information System (INIS)

Ono, Susumu; Kanaya, Koichi

1979-01-01

Attempt was made to present the sufficient solution of the secondary electron yield of metals and semiconductor compounds except insulators, applying the free electron scattering theory to the absorption of secondary electrons generated within a solid target. The paper is divided into the sections describing absorption coefficient and escape depth, quantitative characteristics of secondary yield, angular distribution of secondary electron emission, effect of incident angle to secondary yield, secondary electron yield transmitted, and lateral distribution of secondary electron emission, besides introduction and conclusion. The conclusions are as follows. Based on the exponential power law for screened atomic potential, secondary electron emission due to both primary and backscattered electrons penetrating into metallic elements and semi-conductive compounds is expressed in terms of the ionization loss in the first collision for escaping secondary electrons. The maximum yield and the corresponding primary energy can both consistently be derived as the functions of three parameters: atomic number, first ionization energy and backscattering coefficient. The yield-energy curve as a function of the incident energy and the backscattering coefficient is in good agreement with the experimental results. The energy dependence of the yield in thin films and the lateral distribution of secondary yield are derived as the functions of the backscattering coefficient and the primary energy. (Wakatsuki, Y.)

Very high latitude F-region irregularities observed by HF-radar backscatter

International Nuclear Information System (INIS)

Baker, K.B.; Greenwald, R.A.; Tsunoda, R.T.

1983-01-01

In February and March, 1982, a coherent scatter HF radar was operated from Cleary, Alaska to observe 7- to 15-m wavelength F-region plasma irregularities near the poleward edge of the auroral zone and in the polar cap. The radar operated for five days from February 25 to March 1 and produced approximately 700,000 Doppler spectra during that time. Of those nearly 700,000 spectra, approximately 10% showed backscattered power 3 dB or more above the noise level. A ray tracing technique using electron densities determined by the Chatanika incoherent scatter radar was used to predict locations where the HF waves were approximately normal to the magnetic field. If those locations were also to contain small scale electron density structure, then one would expect them to backscatter the HF waves. Several comparisons were made between predicted and observed locations of radiowave backscatter and excellent agreement was obtained. In addition, comparisons of the Doppler velocities observed by the coherent scatter HF radar and those observed by the Chatanika radar showed good agreement, suggesting that the plasma irregularities observed by the HF radar drift with the ambient plasma. In addition, average vector velocities calculated for the entire 5-day period show a flow pattern consistent with polar cap convection models. This again indicates that the irregularities drift with the plasma, as is predicted by a number of theories of F-region plasma irregularities. In the summer of 1983, the research program begun with those measurements will be continued with a steerable phased-array HF radar located at Goose Bay, Labrador, that will view the same ionospheric region as does the Sondre Stromfjord incoherent scatter radar

Diffraction. Single crystal, magnetic

International Nuclear Information System (INIS)

Heger, G.

1999-01-01

The analysis of crystal structure and magnetic ordering is usually based on diffraction phenomena caused by the interaction of matter with X-rays, neutrons, or electrons. Complementary information is achieved due to the different character of X-rays, neutrons and electrons, and hence their different interactions with matter and further practical aspects. X-ray diffraction using conventional laboratory equipment and/or synchrotron installations is the most important method for structure analyses. The purpose of this paper is to discuss special cases, for which, in addition to this indispensable part, neutrons are required to solve structural problems. Even though the huge intensity of modern synchrotron sources allows in principle the study of magnetic X-ray scattering the investigation of magnetic structures is still one of the most important applications of neutron diffraction. (K.A.)

High-resolution neutron-diffraction measurements to 8 kbar

Science.gov (United States)

Bull, C. L.; Fortes, A. D.; Ridley, C. J.; Wood, I. G.; Dobson, D. P.; Funnell, N. P.; Gibbs, A. S.; Goodway, C. M.; Sadykov, R.; Knight, K. S.

2017-10-01

We describe the capability to measure high-resolution neutron powder diffraction data to a pressure of at least 8 kbar. We have used the HRPD instrument at the ISIS neutron source and a piston-cylinder design of pressure cell machined from a null-scattering titanium zirconium alloy. Data were collected under hydrostatic conditions from an elpasolite perovskite La?NiMnO?; by virtue of a thinner cell wall on the incident-beam side of the cell, it was possible to obtain data in the instrument's highest resolution back-scattering detector banks up to a maximum pressure of 8.5 kbar.

Electron microscopy and diffraction

International Nuclear Information System (INIS)

Gjoennes, J.; Olsen, A.

1986-01-01

This report is a description of research activities and plans at the electron microscopy laboratorium, Physics Department, University of Oslo. Since the first electron microscope was installed in 1968, the research has covered inorganic structures, physical metallurgy, as well as theory of electron scattering and the development of methods in this field. The current plans involve efforts in the development of crystallographic and spectroscopic methods

A laser driven pulsed X-ray backscatter technique for enhanced penetrative imaging.

Science.gov (United States)

Deas, R M; Wilson, L A; Rusby, D; Alejo, A; Allott, R; Black, P P; Black, S E; Borghesi, M; Brenner, C M; Bryant, J; Clarke, R J; Collier, J C; Edwards, B; Foster, P; Greenhalgh, J; Hernandez-Gomez, C; Kar, S; Lockley, D; Moss, R M; Najmudin, Z; Pattathil, R; Symes, D; Whittle, M D; Wood, J C; McKenna, P; Neely, D

2015-01-01

X-ray backscatter imaging can be used for a wide range of imaging applications, in particular for industrial inspection and portal security. Currently, the application of this imaging technique to the detection of landmines is limited due to the surrounding sand or soil strongly attenuating the 10s to 100s of keV X-rays required for backscatter imaging. Here, we introduce a new approach involving a 140 MeV short-pulse (< 100 fs) electron beam generated by laser wakefield acceleration to probe the sample, which produces Bremsstrahlung X-rays within the sample enabling greater depths to be imaged. A variety of detector and scintillator configurations are examined, with the best time response seen from an absorptive coated BaF2 scintillator with a bandpass filter to remove the slow scintillation emission components. An X-ray backscatter image of an array of different density and atomic number items is demonstrated. The use of a compact laser wakefield accelerator to generate the electron source, combined with the rapid development of more compact, efficient and higher repetition rate high power laser systems will make this system feasible for applications in the field. Content includes material subject to Dstl (c) Crown copyright (2014). Licensed under the terms of the Open Government Licence except where otherwise stated. To view this licence, visit http://www.nationalarchives.gov.uk/doc/open-government-licence/version/3 or write to the Information Policy Team, The National Archives, Kew, London TW9 4DU, or email: psi@ nationalarchives.gsi.gov.uk.

Concept and realization of the A4 Compton backscattering polarimeter at MAMI

Energy Technology Data Exchange (ETDEWEB)

Lee, Jeong Han

2008-12-15

The main concern of the A4 parity violation experiment at the Mainzer Microtron accelerator facility is to study the electric and magnetic contributions of strange quarks to the charge and magnetism of the nucleons at the low momentum transfer region. More precisely, the A4 collaboration investigates the strange quarks' contribution to the electric and magnetic vector form factors of the nucleons. Thus, it is important that the A4 experiment uses an adequate and precise non-destructive online monitoring tool for the electron beam polarization when measuring single spin asymmetries in elastic scattering of polarized electrons from unpolarized nucleons. As a consequence, the A4 Compton backscattering polarimeter was designed and installed such that we can take the absolute measurement of the electron beam polarization without interruption to the parity violation experiment. The present study shows the development of an electron beam line that is called the chicane for the A4 Compton backscattering polarimeter. The chicane is an electron beam transport line and provides an interaction region where the electron beam and the laser beam overlap. After studying the properties of beam line components carefully, we developed an electron beam control system that makes a beam overlap between the electron beam and the laser beam. Using the system, we can easily achieve the beam overlap in a short time. The electron control system, of which the performance is outstanding, is being used in production beam times. And the study presents the development of a scintillating fiber electron detector that reduces the statistical error in the electron polarization measurement. We totally redesigned the scintillating fiber detector. The data that were taken during a 2008 beam time shows a huge background suppression, approximately 80 percent, while leaving the Compton spectra almost unchanged when a coincidence between the fiber detector and the photon detector is used. Thus, the

Electron microscopy and diffraction of ordering in Ni-W alloys

International Nuclear Information System (INIS)

Mishra, N.S.

1995-01-01

Electron microscopy and diffraction studies of ordering in stoichiometric Ni-20%W and off-stoichiometric Ni-15%W alloys have been carried out. The specimens of Ni-20%W were first 1,398 K for 4 h and then quenched rapidly into water. Short range order (SRO) spots were observed at {1 1/2 0}* positions. Two hitherto unknown metastable phases: D 2h 25 -Ni 2 W and D0 22 -Ni 3 W were observed in the diffraction patterns. Long range order (LRO) transformations were studied at 1,103 and 1,213 K. Kinetics and mechanism of transformations have been identified. Ni-15%W specimens were solution treated at 1,523 K for 1 h followed by quenching in water. SRO spots similar to those found in Ni-20%W were observed in this alloy as well. The transition to LRO was studied at 1,093 K. Distinct Ni 4 W precipitates could be observed after 5 h of annealing at this temperature. After 100 h of annealing precipitates were found to grow into faceted shape coherent with the disordered matrix. After prolonged annealing for over 150 h the Ni 4 W precipitates began to lose coherency by the generation of misfit dislocations. The microstructural observations have been compared for the stoichiometric and off-stoichiometric alloys

Study of thermal stability of ultrafine-grained copper by means of electron back scattering diffraction

Czech Academy of Sciences Publication Activity Database

Man, O.; Pantělejev, L.; Kunz, Ludvík

2010-01-01

Roč. 51, č. 2 (2010), s. 209-213 ISSN 1345-9678 R&D Projects: GA AV ČR 1QS200410502 Institutional research plan: CEZ:AV0Z20410507 Keywords : ultra-fine grained copper * thermal stability of microstructure * electron back scattering diffraction * grain size * texture Subject RIV: JG - Metallurgy Impact factor: 0.779, year: 2010

Determination of the analyzing power of the A4 Compton-backscattering polarimeter for the measurement of the longitudinal spin polarization of the MAMI electron beam; Bestimmung der Analysierstaerke des A4-Compton-Rueckstreupolarimeters zur Messung der longitudinalen Spinpolarisation des MAMI-Elektronenstrahls

Energy Technology Data Exchange (ETDEWEB)

Diefenbacher, Juergen

2010-08-22

The A4 experiment determines the strange quark contribution to the electromagnetic from factors of the nucleon by measuring the parity violation in elastic electron nucleon scattering. These measurements are carried out using the spin polarized electron beam of the Mainzer Mikrotron (MAMI) with beam energies in the range from 315 to 1508 MeV. For the data analysis it is essential to determine the degree of polarization of the electron beam in order to extract the physics asymmetry from the measured parity violating asymmetry. For this reason the A4 collaboration has developed a novel type of Compton laser backscattering polarimeter that allows for a non-destructive measurement of the beam polarization in parallel to the running parity experiment. In the scope of this work the polarimeter was refined in order to enable reliable continuous operation of the polarimeter. The data acquisition system for the photon and electron detector was re-designed and optimized to cope with high count rates. A novel detector (LYSO) for the backscattered photons was commissioned. Furthermore, GEANT4 simulations of the detectors have been performed and an analysis environment for the extraction of Compton asymmetries from the backscattered photon data has been developed. The analysis makes use of the possibility to detect backscattered photons in coincidence with the scattered electrons, thus tagging the photons. The tagging introduces a differential energy scale which enables the precise determination of the analyzing power. In this work the analyzing power of the polarimeter has been determined. Therefore, at a beam current of 20 {mu}A the product of electron and laser polarization can be determined, while the parity experiment is running, with a statistical accuracy of 1 % in 24 hours at 855 MeV or <1 % in 12 hours at 1508 MeV. Combining this with the determination of the laser polarization carried out in parallel work (Y. Imai), the uncertainty of the electron beam polarization in

Suppressing Ghost Diffraction in E-Beam-Written Gratings

Science.gov (United States)

Wilson, Daniel; Backlund, Johan

2009-01-01

A modified scheme for electron-beam (E-beam) writing used in the fabrication of convex or concave diffraction gratings makes it possible to suppress the ghost diffraction heretofore exhibited by such gratings. Ghost diffraction is a spurious component of diffraction caused by a spurious component of grating periodicity as described below. The ghost diffraction orders appear between the main diffraction orders and are typically more intense than is the diffuse scattering from the grating. At such high intensity, ghost diffraction is the dominant source of degradation of grating performance. The pattern of a convex or concave grating is established by electron-beam writing in a resist material coating a substrate that has the desired convex or concave shape. Unfortunately, as a result of the characteristics of electrostatic deflectors used to control the electron beam, it is possible to expose only a small field - typically between 0.5 and 1.0 mm wide - at a given fixed position of the electron gun relative to the substrate. To make a grating larger than the field size, it is necessary to move the substrate to make it possible to write fields centered at different positions, so that the larger area is synthesized by "stitching" the exposed fields.

Extra spots in the electron diffraction patterns of neutron irradiated zirconium and its alloys

International Nuclear Information System (INIS)

Madden, P.K.

1977-01-01

Specimens of neutron irradiated zirconium and its alloys were examined in the transmission electron microscope. Groups of extra spots, often exhibiting four-fold symmetry, were observed in thin foil electron diffraction patterns of these specimens. The 'extra-spot' structure, like the expected black-dot/small scale dislocation loop neutron irradiated damage, is approximately 100 A in size. Its nature is uncertain. It may be related to irradiation damage or to some artefact introduced during specimen preparation. If it is the latter, then published irradiation damage defect size distributions and determined irradiation growth strains of other investigators, may require modification. The present inconclusive results indicate that extra-spot structure is likely to consist of oxide particles, but may correspond to hydride precipitation or decoration effects, or even, to electron beam effects. (author)

Stimulated Raman backscattering at high laser intensities

Energy Technology Data Exchange (ETDEWEB)

Skoric, M M [Vinca Inst. of Nuclear Sciences, Belgrade (Yugoslavia); Tajima, Toshiki; Sasaki, Akira; Maluckov, A; Jovanovic, M

1998-03-01

Signatures of Stimulated Raman backscattering of a short-pulse high-intensity laser interacting with an underdense plasma are discussed. We introduce a nonlinear three-wave interaction model that accounts for laser pump depletion and relativistic detuning. A mechanism is revealed based on a generic route to chaos, that predicts a progressive increase of the backscatter complexity with a growing laser intensity. Importance of kinetic effects is outlined and demonstrated in fluid-hybrid and particle simulations. As an application, we show that spectral anomalies of the backscatter, predicted by the above model, are consistent with recent sub-picosecond, high-intensity laser gas-target measurements at Livermore and elsewhere. Finally, a recently proposed scheme for generation of ultra-short, low-prepulse laser pulses by Raman backscattering in a thin foil target, is shown. (author)

Understanding the radar backscattering from flooded and nonflooded Amazonian forests: results from canopy backscatter modeling

International Nuclear Information System (INIS)

Wang, Y.; Hess, L.L.; Filoso, S.; Melack, J.M.

1995-01-01

To understand the potential of using multiwavelength imaging radars to detect flooding in Amazonian floodplain forests, we simulated the radar backscatter from a floodplain forest with a flooded or nonflooded ground condition at C-, L-, and P-bands. Field measurements of forest structure in the Anavilhanas archipelago of the Negro River, Brazil, were used as inputs to the model. Given the same wavelength or incidence angle, the ratio of backscatter from the flooded forest to that from the nonflooded forest was higher at HH polarization than at VV polarization. Given the same wavelength or polarization, the ratio was larger at small incidence angles than at large incidence angles. Given the same polarization or incidence angle, the ratio was larger at a long wavelength than at a short wavelength. As the surface soil moisture underneath the nonflooded forest increased from 10% to 50% of volumetric moisture, the flooded/nonflooded backscatter ratio decreased; the decreases were small at C- and L-band but large at P-band. When the leaf size was comparable to or larger than the wavelength of C-band, the leaf area index (LAI) had a large effect on the simulated C-band (not L-band or P-band) backscatter from the flooded and nonflooded forests. (author)

Inverse scattering theory foundations of tomography with diffracting wavefields

International Nuclear Information System (INIS)

Devaney, A.J.

1987-01-01

The underlying mathematical models employed in reflection and transmission computed tomography using diffracting wavefields (called diffraction tomography) are reviewed and shown to have a rigorous basis in inverse scattering theory. In transmission diffraction tomography the underlying wave model is shown to be the Rytov approximation to the complex phase of the wavefield transmitted by the object being probed while in reflection diffraction tomography the underlying wave model is shown to be the Born approximation to the backscattered wavefield from the object. In both cases the goal of the reconstruction process is the determination of the objects's complex index of refraction as a function of position r/sup →/ and, possibly, the frequency ω of the probing wavefield. By use of these approximations the reconstruction problem for both transmission and reflection diffraction tomography can be cast into the simple and elegant form of linearized inverse scattering theory. Linearized inverse scattering theory is shown to lead directly to generalized projection-slice theorems for both reflection and transmission diffraction tomography that provide a simple mathematical relationship between the object's complex index of refraction (the unknown) and the data (the complex phase of the transmitted wave or the complex amplitude of the reflected wave). The conventional projection-slice theorem of X-ray CT is shown to result from the generalized projection-slice theorem for transmission diffraction tomography in the limit of vanishing wavelength (in the absence of wave effects). Fourier based and back-projection type reconstruction algorithms are shown to be directly derivable from the generalized projection-slice theorems

Nodule bottom backscattering study using multibeam echosounder

Digital Repository Service at National Institute of Oceanography (India)

Chakraborty, B.; Raju, Y.S.N.; Nair, R.R.

A study is carried out to observe the angular dependence of backscattering strength at nodule area where grab sample and photographic data is available. Theoretical study along with the experimentally observed data shows that the backscattering...

The vacancy order-disorder transition in Ba2YCu3Osub(7-delta) observed by means of electron diffraction and electron microscopy

International Nuclear Information System (INIS)

Tendeloo, G. Van; Amelinckx, S.; Zandbergen, H.W.

1987-01-01

It is shown by means of electron microscopy and electron diffraction that the ''structural'' vacancies in Ba 2 YCu 3 Osub(7-delta) undergo an order-disorder transformation accompanied by a change in symmetry from orthorhombic to tetragonal. A superstructure due to the ordering of vacancies was found in certain crystal parts; it leads to doubling of the asub(0) parameter. It is shown that the ordering of the vacancies is important for the superconducting behaviour. In order to obtain a high Tsub(c) superconductor the final heat treatment is crucial. (author)

An Ultrasonic Backscatter Instrument for Cancellous Bone Evaluation in Neonates

Directory of Open Access Journals (Sweden)

Chengcheng Liu

2015-09-01

Full Text Available Ultrasonic backscatter technique has shown promise as a noninvasive cancellous bone assessment tool. A novel ultrasonic backscatter bone diagnostic (UBBD instrument and an in vivo application for neonatal bone evaluation are introduced in this study. The UBBD provides several advantages, including noninvasiveness, non-ionizing radiation, portability, and simplicity. In this study, the backscatter signal could be measured within 5 s using the UBBD. Ultrasonic backscatter measurements were performed on 467 neonates (268 males and 199 females at the left calcaneus. The backscatter signal was measured at a central frequency of 3.5 MHz. The delay (T1 and duration (T2 of the backscatter signal of interest (SOI were varied, and the apparent integrated backscatter (AIB, frequency slope of apparent backscatter (FSAB, zero frequency intercept of apparent backscatter (FIAB, and spectral centroid shift (SCS were calculated. The results showed that the SOI selection had a direct influence on cancellous bone evaluation. The AIB and FIAB were positively correlated with the gestational age (|R| up to 0.45, P10 µs. Moderate positive correlations (|R| up to 0.45, P10 µs. The T2 mainly introduced fluctuations in the observed correlation coefficients. The moderate correlations observed with UBBD demonstrate the feasibility of using the backscatter signal to evaluate neonatal bone status. This study also proposes an explicit standard for in vivo SOI selection and neonatal cancellous bone assessment.

A study on the secondary electrons in a clinical electron beam

International Nuclear Information System (INIS)

Krithivas, G.; Rao, S.N.

1989-01-01

The central axis dose of a 12 MeV clinical electron beam is investigated in terms of an axial component due to primary electrons in the central ray and a lateral component due to secondary electrons originating from multiple scattering of electrons in the off-axis rays. To this effect secondary electron fluence measurements in a polystyrene medium irradiated with a collimated beam are made with a sensitive diode detector. This leads to a construction of secondary electron depth-dose profiles for beam sizes of diameters ranging from 1.7 to 17.4 cm. The results indicate that the lateral electrons account for 25% of the dose in the therapeutic region. For these electrons, the depth of dose maximum is correlated with diffusion depth and maximum lateral excursion in the medium. Dose component due to backscatter electrons at depths is also investigated using a thin-window parallel-plate ion chamber. The role of lateral and backscatter electrons in characterising central axis per cent depth-dose is discussed. (author)

3D Backscatter Imaging System

Science.gov (United States)

Whitaker, Ross (Inventor); Turner, D. Clark (Inventor)

2016-01-01

Systems and methods for imaging an object using backscattered radiation are described. The imaging system comprises both a radiation source for irradiating an object that is rotationally movable about the object, and a detector for detecting backscattered radiation from the object that can be disposed on substantially the same side of the object as the source and which can be rotationally movable about the object. The detector can be separated into multiple detector segments with each segment having a single line of sight projection through the object and so detects radiation along that line of sight. Thus, each detector segment can isolate the desired component of the backscattered radiation. By moving independently of each other about the object, the source and detector can collect multiple images of the object at different angles of rotation and generate a three dimensional reconstruction of the object. Other embodiments are described.

Analysis of dislocation loops by means of large-angle convergent beam electron diffraction

CERN Document Server

Jäger, C; Morniroli, J P; Jäger, W

2002-01-01

Diffusion-induced dislocation loops in GaP and GaAs were analysed by means of large-angle convergent beam electron diffraction (LACBED) and conventional contrast methods of transmission electron microscopy. It is demonstrated that LACBED is perfectly suited for use in analysing dislocation loops. The method combines analyses of the dislocation-induced splitting of Bragg lines in a LACBED pattern for the determination of the Burgers vector with analyses of the loop contrast behaviour in transmission electron microscopy bright-field images during tilt experiments, from which the habit plane of the dislocation loop is determined. Perfect dislocation loops formed by condensation of interstitial atoms or vacancies were found, depending on the diffusion conditions. The loops possess left brace 110 right brace-habit planes and Burgers vectors parallel to (110). The LACBED method findings are compared with results of contrast analyses based on the so-called 'inside-outside' contrast of dislocation loops. Advantages o...

Electron diffraction determination of 11.5 Å and HySo structures: candidate water carriers to the Upper Mantle

Czech Academy of Sciences Publication Activity Database

Gemmi, M.; Merlini, M.; Palatinus, Lukáš; Fumagalli, P.; Hanfland, M.

2016-01-01

Roč. 101, č. 12 (2016), s. 2645-2654 ISSN 0003-004X Institutional support: RVO:68378271 Keywords : subduction * MASH system * electron diffraction tomography Subject RIV: DB - Geology ; Mineralogy Impact factor: 2.021, year: 2016

Semiconductor Quantum Electron Wave Transport, Diffraction, and Interference: Analysis, Device, and Measurement.

Science.gov (United States)

Henderson, Gregory Newell

Semiconductor device dimensions are rapidly approaching a fundamental limit where drift-diffusion equations and the depletion approximation are no longer valid. In this regime, quantum effects can dominate device response. To increase further device density and speed, new devices must be designed that use these phenomena to positive advantage. In addition, quantum effects provide opportunities for a new class of devices which can perform functions previously unattainable with "conventional" semiconductor devices. This thesis has described research in the analysis of electron wave effects in semiconductors and the development of methods for the design, fabrication, and characterization of quantum devices based on these effects. First, an exact set of quantitative analogies are presented which allow the use of well understood optical design and analysis tools for the development of electron wave semiconductor devices. Motivated by these analogies, methods are presented for modeling electron wave grating diffraction using both an exact rigorous coupled-wave analysis and approximate analyses which are useful for grating design. Example electron wave grating switch and multiplexer designs are presented. In analogy to thin-film optics, the design and analysis of electron wave Fabry-Perot interference filters are also discussed. An innovative technique has been developed for testing these (and other) electron wave structures using Ballistic Electron Emission Microscopy (BEEM). This technique uses a liquid-helium temperature scanning tunneling microscope (STM) to perform spectroscopy of the electron transmittance as a function of electron energy. Experimental results show that BEEM can resolve even weak quantum effects, such as the reflectivity of a single interface between materials. Finally, methods are discussed for incorporating asymmetric electron wave Fabry-Perot filters into optoelectronic devices. Theoretical and experimental results show that such structures could

Interlinking backscatter, grain size and benthic community structure

Science.gov (United States)

McGonigle, Chris; Collier, Jenny S.

2014-06-01

The relationship between acoustic backscatter, sediment grain size and benthic community structure is examined using three different quantitative methods, covering image- and angular response-based approaches. Multibeam time-series backscatter (300 kHz) data acquired in 2008 off the coast of East Anglia (UK) are compared with grain size properties, macrofaunal abundance and biomass from 130 Hamon and 16 Clamshell grab samples. Three predictive methods are used: 1) image-based (mean backscatter intensity); 2) angular response-based (predicted mean grain size), and 3) image-based (1st principal component and classification) from Quester Tangent Corporation Multiview software. Relationships between grain size and backscatter are explored using linear regression. Differences in grain size and benthic community structure between acoustically defined groups are examined using ANOVA and PERMANOVA+. Results for the Hamon grab stations indicate significant correlations between measured mean grain size and mean backscatter intensity, angular response predicted mean grain size, and 1st principal component of QTC analysis (all p PERMANOVA for the Hamon abundance shows benthic community structure was significantly different between acoustic groups for all methods (p ≤ 0.001). Overall these results show considerable promise in that more than 60% of the variance in the mean grain size of the Clamshell grab samples can be explained by mean backscatter or acoustically-predicted grain size. These results show that there is significant predictive capacity for sediment characteristics from multibeam backscatter and that these acoustic classifications can have ecological validity.

Vibrational and electronic excitation of hexatriacontane thin films by low energy electron impact

International Nuclear Information System (INIS)

Vilar, M.R.; Schott, M.; Pfluger, P.

1990-01-01

Thin polycrystalline films of hexatriacontane (HTC) were irradiated with low energy (E=0.5--15 eV) electrons, and off-specular backscattered electron spectra were measured. Below E∼7 eV, single and multiple vibrational excitations only are observed, which relax the electrons down to the bottom of the HTC conduction band. Due to the negative electron affinity of HTC, thermal electrons are emitted into vacuum. Structure in the backscattered electron current at kinetic energies about 1.5 and 4 eV are associated to conduction band density of states. Above E∼7 eV, the dominant losses correspond to electronic excitations, excitons, or above a threshold (energy of the electron inside the HTC film) at 9.2±0.1 eV, electron--hole pair generation. The latter process is very efficient and reaches a yield of the order of one ∼11 eV. Evidence for chemical reaction above E∼4 eV is observed

EBSD spatial resolution for detecting sigma phase in steels

Energy Technology Data Exchange (ETDEWEB)

Bordín, S. Fernandez; Limandri, S. [Instituto de Física Enrique Gaviola, CONICET. M. Allende s/n, Ciudad Universitaria, 5000 Córdoba (Argentina); Ranalli, J.M. [Comisión Nacional de Energía Atómica, Av. Gral. Paz 1499, San Martín, 1650 Buenos Aires (Argentina); Castellano, G. [Instituto de Física Enrique Gaviola, CONICET. M. Allende s/n, Ciudad Universitaria, 5000 Córdoba (Argentina)

2016-12-15

The spatial resolution of the electron backscatter diffraction signal is explored by Monte Carlo simulation for the sigma phase in steel at a typical instrumental set-up. In order to estimate the active volume corresponding to the diffracted electrons, the fraction of the backscattered electrons contributing to the diffraction signal was inferred by extrapolating the Kikuchi pattern contrast measured by other authors, as a function of the diffracted electron energy. In the resulting estimation, the contribution of the intrinsic incident beam size and the software capability to deconvolve patterns were included. A strong influence of the beam size on the lateral resolution was observed, resulting in 20 nm for the aperture considered. For longitudinal and depth directions the resolutions obtained were 75 nm and 16 nm, respectively. The reliability of this last result is discussed in terms of the survey of the last large-angle deflection undergone by the backscattered electrons involved in the diffraction process. Bearing in mind the mean transversal resolution found, it was possible to detect small area grains of sigma phase by EBSD measurements, for a stabilized austenitic AISI 347 stainless steel under heat treatments, simulating post welding (40 h at 600 °C) and aging (284 h at 484 °C) effects—as usually occurring in nuclear reactor pressure vessels. - Highlights: • EBSD spatial resolution is studied by Monte Carlo simulation for σ-phase in steel. • The contribution of the intrinsic incident beam size was included. • A stabilized austenitic stainless steel under heat treatments was measured by EBSD. • With the transversal resolution found, small area σ-phase grains could be identified.

X-ray backscatter imaging with a spiral scanner

International Nuclear Information System (INIS)

Bossi, R.H.; Cline, J.L.; Friddell, K.D.

1989-01-01

X-ray backscatter imaging allows radiographic inspections to be performed with access to only one side of the object. A collimated beam of radiation striking an object will scatter x-rays by Compton scatter and x-ray fluorescence. A detector located on the source side of the part will measure the backscatter signal. By plotting signal strength as gray scale intensity vs. beam position on the object, an image of the object can be constructed. A novel approach to the motion of the collimated incident beam is a spiral scanner. The spiral scanner approach, described in this paper, can image an area of an object without the synchronized motion of the object or detector, required by other backscatter imaging techniques. X-ray backscatter is particularly useful for flaw detection in light element materials such as composites. The ease of operation and the ability to operate non-contact from one side of an object make x-ray backscatter imaging of increasing interest to industrial inspection problems

On line ultrasonic integrated backscatter

International Nuclear Information System (INIS)

Landini, L.; Picano, E.; Mazzarisi, A.; Santarelli, F.; Benassi, A.; De Pieri, G.

1988-01-01

A new equipment for on-line evaluation of index based on two-dimensional integrated backscatter from ultrasonic images is described. The new equipment is fully integrated into a B-mode ultrasonic apparatus which provides a simultaneous display of conventional information together with parameters of tissue characterization. The system has been tested with a backscattering model of microbubbles in polysaccharide solution, characterized by a physiological exponential time decay. An exponential fitting to the experimental data was performed which yielded r=0.95

Temperature-dependent surface structure, composition, and electronic properties of the clean SrTiO3(111) crystal face: Low-energy-electron diffraction, Auger-electron spectroscopy, electron energy loss, and ultraviolet-photoelectron spectroscopy studies

International Nuclear Information System (INIS)

Lo, W.J.; Somorjai, G.A.

1978-01-01

Low-energy-electron diffraction, Auger-electron spectroscopy, electron-energy-loss, and ultraviolet-photoelectron spectroscopies were used to study the structure, composition, and electron energy distribution of a clean single-crystal (111) face of strontium titanate (perovskite). The dependence of the surface chemical composition on the temperature has been observed along with corresponding changes in the surface electronic properties. High-temperature Ar-ion bombardment causes an irreversible change in the surface structure, stoichiometry, and electron energy distribution. In contrast to the TiO 2 surface, there are always significant concentrations of Ti 3+ in an annealed ordered SrTiO 3 (111) surface. This stable active Ti 3+ monolayer on top of a substrate with large surface dipole potential makes SrTiO 3 superior to TiO 2 when used as a photoanode in the photoelectrochemical cell

Backscattering at a pulsed neutron source, the MUSICAL instrument

International Nuclear Information System (INIS)

Alefeld, B.

1995-01-01

In the first part the principles of the neutron backscattering method are described and some simple considerations about the energy resolution and the intensity are presented. A prototype of a backscattering instrument, the first Juelich instrument, is explained in some detail and a representative measurement is shown which was performed on the backscattering instrument IN10 at the ILL in Grenoble. In the second part a backscattering instrument designed for a pulsed neutron source is proposed. It is shown that a rather simple modification, which consists in the replacement of the Doppler drive of the conventional backscattering instrument by a multi silicon monochromator crystal (MUSICAL) leads to a very effective instrument, benefitting from the peak flux of the pulsed source. ((orig.))

Super-virtual Interferometric Separation and Enhancement of Back-scattered Surface Waves

KAUST Repository

Guo, Bowen

2015-08-19

Back-scattered surface waves can be migrated to detect near-surface reflectors with steep dips. A robust surface-wave migration requires the prior separation of the back-scattered surface-wave events from the data. This separation is often difficult to implement because the back-scattered surface waves are masked by the incident surface waves. We mitigate this problem by using a super-virtual interferometric method to enhance and separate the back-scattered surface waves. The key idea is to calculate the virtual back-scattered surface waves by stacking the resulting virtual correlated and convolved traces associated with the incident and back-scattered waves. Stacking the virtual back-scattered surface waves improves their signal-to-noise ratio and separates the back-scattered surface-waves from the incident field. Both synthetic and field data results validate the robustness of this method.

Backscattering of projectile-bound electrons from solid surfaces

International Nuclear Information System (INIS)

Tobisch, M.; Schosnig, M.; Kroneberger, K.; Kuzel, M.; Maier, R.; Jung, M.; Fiedler, C.; Rothard, H.; Clouvas, A.; Suarez, S.; Groeneveld, K.O.

1994-01-01

The contribution of projectile ionization (PI) to secondary electron emission is studied by collision of H 2 + and H 3 + ions (400 keV/u and 700 keV/u) with carbon, copper and gold targets (600 A). The measured doubly differential intensity distribution shows a peak of lost projectile electrons near - v p . We describe the subtraction of the contribution of target ionization (TI), and compare the remaining electron intensities with a BEA calculation. For solids we observe a strong energy shift of the electron loss peak, which is compared with the influence of electron transport and binding energy. Furthermore, the low energy tail of the electron loss peak indicates the simultaneous occurrence of PI and TI. Finally we discuss the influence of surface conditions and the dependence of the observation angles on the measured electron intensities. (orig.)

Single-particle coherent diffractive imaging with a soft x-ray free electron laser: towards soot aerosol morphology

Science.gov (United States)

Bogan, Michael J.; Starodub, Dmitri; Hampton, Christina Y.; Sierra, Raymond G.

2010-10-01

The first of its kind, the Free electron LASer facility in Hamburg, FLASH, produces soft x-ray pulses with unprecedented properties (10 fs, 6.8-47 nm, 1012 photons per pulse, 20 µm diameter). One of the seminal FLASH experiments is single-pulse coherent x-ray diffractive imaging (CXDI). CXDI utilizes the ultrafast and ultrabright pulses to overcome resolution limitations in x-ray microscopy imposed by x-ray-induced damage to the sample by 'diffracting before destroying' the sample on sub-picosecond timescales. For many lensless imaging algorithms used for CXDI it is convenient when the data satisfy an oversampling constraint that requires the sample to be an isolated object, i.e. an individual 'free-standing' portion of disordered matter delivered to the centre of the x-ray focus. By definition, this type of matter is an aerosol. This paper will describe the role of aerosol science methodologies used for the validation of the 'diffract before destroy' hypothesis and the execution of the first single-particle CXDI experiments being developed for biological imaging. FLASH CXDI now enables the highest resolution imaging of single micron-sized or smaller airborne particulate matter to date while preserving the native substrate-free state of the aerosol. Electron microscopy offers higher resolution for single-particle analysis but the aerosol must be captured on a substrate, potentially modifying the particle morphology. Thus, FLASH is poised to contribute significant advancements in our knowledge of aerosol morphology and dynamics. As an example, we simulate CXDI of combustion particle (soot) morphology and introduce the concept of extracting radius of gyration of fractal aggregates from single-pulse x-ray diffraction data. Future upgrades to FLASH will enable higher spatially and temporally resolved single-particle aerosol dynamics studies, filling a critical technological need in aerosol science and nanotechnology. Many of the methodologies described for FLASH will

Single-particle coherent diffractive imaging with a soft x-ray free electron laser: towards soot aerosol morphology

International Nuclear Information System (INIS)

Bogan, Michael J; Starodub, Dmitri; Hampton, Christina Y; Sierra, Raymond G

2010-01-01

The first of its kind, the Free electron LASer facility in Hamburg, FLASH, produces soft x-ray pulses with unprecedented properties (10 fs, 6.8-47 nm, 10 12 photons per pulse, 20 μm diameter). One of the seminal FLASH experiments is single-pulse coherent x-ray diffractive imaging (CXDI). CXDI utilizes the ultrafast and ultrabright pulses to overcome resolution limitations in x-ray microscopy imposed by x-ray-induced damage to the sample by 'diffracting before destroying' the sample on sub-picosecond timescales. For many lensless imaging algorithms used for CXDI it is convenient when the data satisfy an oversampling constraint that requires the sample to be an isolated object, i.e. an individual 'free-standing' portion of disordered matter delivered to the centre of the x-ray focus. By definition, this type of matter is an aerosol. This paper will describe the role of aerosol science methodologies used for the validation of the 'diffract before destroy' hypothesis and the execution of the first single-particle CXDI experiments being developed for biological imaging. FLASH CXDI now enables the highest resolution imaging of single micron-sized or smaller airborne particulate matter to date while preserving the native substrate-free state of the aerosol. Electron microscopy offers higher resolution for single-particle analysis but the aerosol must be captured on a substrate, potentially modifying the particle morphology. Thus, FLASH is poised to contribute significant advancements in our knowledge of aerosol morphology and dynamics. As an example, we simulate CXDI of combustion particle (soot) morphology and introduce the concept of extracting radius of gyration of fractal aggregates from single-pulse x-ray diffraction data. Future upgrades to FLASH will enable higher spatially and temporally resolved single-particle aerosol dynamics studies, filling a critical technological need in aerosol science and nanotechnology. Many of the methodologies described for FLASH will

Structure determination of disordered organic molecules on surfaces from the Bragg spots of low-energy electron diffraction and total energy calculations

International Nuclear Information System (INIS)

Poon, H.C.; Weinert, M.; Saldin, D.K.; Stacchiola, D.; Zheng, T.; Tysoe, W.T.

2004-01-01

We show that an analysis of the intensity versus energy variation of Bragg spots due to low-energy electron diffraction from a disordered overlayer of molecules on a crystal surface allows a much more convenient method of determining the local adsorption geometries of such molecules than previously analyzed weak diffuse diffraction patterns. For the case of methanol on Pd(111), we show that the geometry determined by this means from experimental diffraction data is in excellent agreement with the predictions of density functional total energy calculations

Structures of Astromaterials Revealed by EBSD

Science.gov (United States)

Zolensky, M.

2018-01-01

Groups at the Johnson Space Center and the University of Tokyo have been using electron back-scattered diffraction (EBSD) to reveal the crystal structures of extraterrestrial minerals for many years. Even though we also routinely use transmission electron microscopy, synchrotron X-ray diffraction (SXRD), and conventional electron diffraction, we find that EBSD is the most powerful technique for crystal structure elucidation in many instances. In this talk I describe a few of the cases where we have found EBSD to provide crucial, unique information. See attachment.

Quantitative low-energy electron diffraction analysis of the GaN(000-1) (1×1) reconstruction

Czech Academy of Sciences Publication Activity Database

Romanyuk, Olexandr; Jiříček, Petr; Paskova, T.

2012-01-01

Roč. 606, 7-8 (2012), s. 740-743 ISSN 0039-6028 R&D Projects: GA ČR GPP204/10/P028 Institutional research plan: CEZ:AV0Z10100521 Keywords : gallium nitride * semiconductor surfaces * quantitative low-energy electron diffraction * LEED Subject RIV: BM - Solid Matter Physics ; Magnetism Impact factor: 1.838, year: 2012

Electron diffraction and high-resolution transmission electron microscopy of the high temperature crystal structures of GexSb2Te3+x (x=1,2,3) phase change material

NARCIS (Netherlands)

Kooi, B.J.; de Hosson, J.T.M.

2002-01-01

The crystal structures of GeSb2Te4, Ge2Sb2Te5, and Ge3Sb2Te6 were determined using electron diffraction and high-resolution transmission electron microscopy. The structure determined for the former two crystals deviates from the ones proposed in the literature. These crystal structures were

Experimental determination of spin-dependent electron density by joint refinement of X-ray and polarized neutron diffraction data.

Science.gov (United States)

Deutsch, Maxime; Claiser, Nicolas; Pillet, Sébastien; Chumakov, Yurii; Becker, Pierre; Gillet, Jean Michel; Gillon, Béatrice; Lecomte, Claude; Souhassou, Mohamed

2012-11-01

New crystallographic tools were developed to access a more precise description of the spin-dependent electron density of magnetic crystals. The method combines experimental information coming from high-resolution X-ray diffraction (XRD) and polarized neutron diffraction (PND) in a unified model. A new algorithm that allows for a simultaneous refinement of the charge- and spin-density parameters against XRD and PND data is described. The resulting software MOLLYNX is based on the well known Hansen-Coppens multipolar model, and makes it possible to differentiate the electron spins. This algorithm is validated and demonstrated with a molecular crystal formed by a bimetallic chain, MnCu(pba)(H(2)O)(3)·2H(2)O, for which XRD and PND data are available. The joint refinement provides a more detailed description of the spin density than the refinement from PND data alone.

Quantitative investigation of precipitate growth during ageing of Al-(Mg,Si) alloys by energy-filtered electron diffraction

DEFF Research Database (Denmark)

Wollgarten, M.; Chang, C. S. T.; Duchstein, Linus Daniel Leonhard

2011-01-01

Besides other application fields, light-weight Al-(Mg, Si) (6XXX series) alloys are of substantial importance in automotive industries where they are used for the production of car body panels. The material gains its strength by precipitation of metastable Mg-Si-based phases. Though the general...... accepted that the early stages of precipitate growth are important for the understanding of this peculiar behaviour. During these stages, electron diffraction patterns of Al-(Mg, Si) alloys show diffuse features (Figure 1 (a) and (b)) which can be traced back to originate from β'' Mg5Si6 precipitates [5......-7]. In this paper, we use energy-filtered electron diffraction to determine dimensions of the β'' Mg5Si6 precipitates along their a, b and c-axes as a function of ageing time and alloy composition. In our contribution, we first derive that there is an optimal zone axis - - from the view point of practicability. We...

Neutron diffraction and oxide research

International Nuclear Information System (INIS)

Hunter, B.; Howard, C.J.; Kennedy, B.J.

1999-01-01

Oxide compounds form a large class of interesting materials that have a diverse range of mechanical and electronic properties. This diversity and its commercial implications has had a significant impact on physics research. This is particularly evident in the fields of superconductivity magnetoresistivity and ferroelectricity, where discoveries in the last 15 years have given rise to significant shifts in research activities. Historically, oxides have been studied for many years, but it is only recently that significant effort has been diverted to the study of oxide materials for their application to mechanical and electronic devices. An important property of such materials is the atomic structure, for the determination of which diffraction techniques are ideally suited. Recent examples of structure determinations using neutron diffraction in oxide based systems are high temperature superconductors, where oxygen defects are a key factor. Here, neutron diffraction played a major role in determining the effect of oxygen on the superconducting properties. Similarly, neutron diffraction has enjoyed much success in the determination of the structures of the manganate based colossal magnetoresistive (CMR) materials. In both these cases the structure plays a pivotal role in determining theoretical models of the electronic properties. The neutron scattering group at ANSTO has investigated several oxide systems using neutron powder diffraction. Two such systems are presented in this paper; the zirconia-based materials that are used as engineering materials, and the perovskite-based oxides that include the well known cuprate superconductors and the manganate CMR materials

Design and implementation of an optimal laser pulse front tilting scheme for ultrafast electron diffraction in reflection geometry with high temporal resolution

Directory of Open Access Journals (Sweden)

Francesco Pennacchio

2017-07-01

Full Text Available Ultrafast electron diffraction is a powerful technique to investigate out-of-equilibrium atomic dynamics in solids with high temporal resolution. When diffraction is performed in reflection geometry, the main limitation is the mismatch in group velocity between the overlapping pump light and the electron probe pulses, which affects the overall temporal resolution of the experiment. A solution already available in the literature involved pulse front tilt of the pump beam at the sample, providing a sub-picosecond time resolution. However, in the reported optical scheme, the tilted pulse is characterized by a temporal chirp of about 1 ps at 1 mm away from the centre of the beam, which limits the investigation of surface dynamics in large crystals. In this paper, we propose an optimal tilting scheme designed for a radio-frequency-compressed ultrafast electron diffraction setup working in reflection geometry with 30 keV electron pulses containing up to 105 electrons/pulse. To characterize our scheme, we performed optical cross-correlation measurements, obtaining an average temporal width of the tilted pulse lower than 250 fs. The calibration of the electron-laser temporal overlap was obtained by monitoring the spatial profile of the electron beam when interacting with the plasma optically induced at the apex of a copper needle (plasma lensing effect. Finally, we report the first time-resolved results obtained on graphite, where the electron-phonon coupling dynamics is observed, showing an overall temporal resolution in the sub-500 fs regime. The successful implementation of this configuration opens the way to directly probe structural dynamics of low-dimensional systems in the sub-picosecond regime, with pulsed electrons.