Vector wave diffraction pattern of slits masked by polarizing devices

Indian Academy of Sciences (India)

This calls for a systematic study of diffraction properties of different apertures using polarization-sensitive devices. In the present paper, we have studied the Fraunhofer diffraction pattern of slits masked by different kinds of polarizing devices which introduce a phase difference between the two orthogonal components of the ...

Calculation of Debye-Scherrer diffraction patterns from highly stressed polycrystalline materials

Energy Technology Data Exchange (ETDEWEB)

MacDonald, M. J., E-mail: macdonm@umich.edu [Applied Physics Program, University of Michigan, Ann Arbor, Michigan 48109 (United States); SLAC National Accelerator Laboratory, Menlo Park, California 94025 (United States); Vorberger, J. [Helmholtz Zentrum Dresden-Rossendorf, 01328 Dresden (Germany); Gamboa, E. J.; Glenzer, S. H.; Fletcher, L. B. [SLAC National Accelerator Laboratory, Menlo Park, California 94025 (United States); Drake, R. P. [Climate and Space Sciences and Engineering, Applied Physics, and Physics, University of Michigan, Ann Arbor, Michigan 48109 (United States)

2016-06-07

Calculations of Debye-Scherrer diffraction patterns from polycrystalline materials have typically been done in the limit of small deviatoric stresses. Although these methods are well suited for experiments conducted near hydrostatic conditions, more robust models are required to diagnose the large strain anisotropies present in dynamic compression experiments. A method to predict Debye-Scherrer diffraction patterns for arbitrary strains has been presented in the Voigt (iso-strain) limit [Higginbotham, J. Appl. Phys. 115, 174906 (2014)]. Here, we present a method to calculate Debye-Scherrer diffraction patterns from highly stressed polycrystalline samples in the Reuss (iso-stress) limit. This analysis uses elastic constants to calculate lattice strains for all initial crystallite orientations, enabling elastic anisotropy and sample texture effects to be modeled directly. The effects of probing geometry, deviatoric stresses, and sample texture are demonstrated and compared to Voigt limit predictions. An example of shock-compressed polycrystalline diamond is presented to illustrate how this model can be applied and demonstrates the importance of including material strength when interpreting diffraction in dynamic compression experiments.

Diffraction by disordered polycrystalline fibers

International Nuclear Information System (INIS)

Stroud, W.J.; Millane, R.P.

1995-01-01

X-ray diffraction patterns from some polycrystalline fibers show that the constituent microcrystallites are disordered. The relationship between the crystal structure and the diffracted intensities is then quite complicated and depends on the precise kind and degree of disorder present. The effects of disorder on diffracted intensities must be included in structure determinations using diffraction data from such specimens. Theory and algorithms are developed here that allow the full diffraction pattern to be calculated for a disordered polycrystalline fiber made up of helical molecules. The model accommodates various kinds of disorder and includes the effects of finite crystallite size and cylindrical averaging of the diffracted intensities from a fiber. Simulations using these methods show how different kinds, or components, of disorder produce particular diffraction effects. General properties of disordered arrays of helical molecules and their effects on diffraction patterns are described. Implications for structure determination are discussed. (orig.)

Diffraction-based overlay metrology for double patterning technologies

Science.gov (United States)

Dasari, Prasad; Korlahalli, Rahul; Li, Jie; Smith, Nigel; Kritsun, Oleg; Volkman, Cathy

2009-03-01

The extension of optical lithography to 32nm and beyond is made possible by Double Patterning Techniques (DPT) at critical levels of the process flow. The ease of DPT implementation is hindered by increased significance of critical dimension uniformity and overlay errors. Diffraction-based overlay (DBO) has shown to be an effective metrology solution for accurate determination of the overlay errors associated with double patterning [1, 2] processes. In this paper we will report its use in litho-freeze-litho-etch (LFLE) and spacer double patterning technology (SDPT), which are pitch splitting solutions that reduce the significance of overlay errors. Since the control of overlay between various mask/level combinations is critical for fabrication, precise and accurate assessment of errors by advanced metrology techniques such as spectroscopic diffraction based overlay (DBO) and traditional image-based overlay (IBO) using advanced target designs will be reported. A comparison between DBO, IBO and CD-SEM measurements will be reported. . A discussion of TMU requirements for 32nm technology and TMU performance data of LFLE and SDPT targets by different overlay approaches will be presented.

Quantitative analysis of calcined fertilizers by X-ray diffraction patterns

International Nuclear Information System (INIS)

Cekinski, E.

1987-01-01

An X-ray diffraction pattern method for quantitative analyses of phosphate fertilizers obtained by calcination of a misture of Anitapolis phosphate concentrate and sodium carbonate is described. The method consists in plotting a calibration curve, using spinel (MgAl 2 O 4 ) as internal standard, of the phases that were formed by calcination, sintetized in laboratory. The tests conducted in order to avail the method accuracy showed good correlation between the obtained data and the real values. (author) [pt

Inversion of convergent-beam electron diffraction patterns

International Nuclear Information System (INIS)

Bird, D.M.; Saunders, M.

1992-01-01

The problem of recovering the structure factors that contribute to a zone-axis convergent-beam diffraction pattern is discussed. It is shown that an automated matching procedure that minimizes the sum-of-squares difference between experimental and simulated patterns is effective whether one is refining accurate structure factors in a known crystal or attempting ab initio structure determination. The details of the minimization method are analysed and it is shown that a quasi-Newton method that uses analytically derived gradients is particulary effective when several structure factors are varied. The inversion method for ab initio structure determination is tested on the [110] axis of GaP, using simulated patterns as ideal 'experimental' data. (orig.)

Circular Hough transform diffraction analysis: A software tool for automated measurement of selected area electron diffraction patterns within Digital Micrograph{sup TM}

Energy Technology Data Exchange (ETDEWEB)

Mitchell, D.R.G. [Institute of Materials and Engineering Science, ANSTO, PMB 1, Menai, NSW 2234 (Australia)], E-mail: drm@ansto.gov.au

2008-03-15

A software tool (script and plugin) for computing circular Hough transforms (CHT) in Digital Micrograph{sup TM} has been developed, for the purpose of automated analysis of selected area electron diffraction patterns (SADPs) of polycrystalline materials. The CHT enables the diffraction pattern centre to be determined with sub-pixel accuracy, regardless of the exposure condition of the transmitted beam or if a beam stop is present. Radii of the diffraction rings can also be accurately measured with sub-pixel precision. If the pattern is calibrated against a known camera length, then d-spacings with an accuracy of better than 1% can be obtained. These measurements require no a priori knowledge of the pattern and very limited user interaction. The accuracy of the CHT is degraded by distortion introduced by the projector lens, and this should be minimised prior to pattern acquisition. A number of optimisations in the CHT software enable rapid processing of patterns; a typical analysis of a 1kx1k image taking just a few minutes. The CHT tool appears robust and is even able to accurately measure SADPs with very incomplete diffraction rings due to texture effects. This software tool is freely downloadable via the Internet.

X-ray diffraction from ideal mosaic crystals in external fields of certain types. I. Atomic displacements and the corresponding diffraction patterns

International Nuclear Information System (INIS)

Treushnikov, E.N.

2000-01-01

The problem of the theoretical description of X-ray diffraction from ideal mosaic crystals under the effect of various external fields has been formulated. Electric, magnetic, electromagnetic, and acoustic perturbations are considered. The atomic displacements in crystals under the effect of external fields and the types of the corresponding diffraction patterns are analyzed for various types of perturbations. The crystal classes are determined in which atomic displacements can be recorded experimentally. Diffraction patterns formed under the effect of various external factors are considered on the basis of the derived dependence of the structure factor on the characteristics of an applied force field

Electron diffraction patterns with thermal diffuse scattering maxima around Kikuchi lines

International Nuclear Information System (INIS)

Karakhanyan, R. K.; Karakhanyan, K. R.

2011-01-01

Transmission electron diffraction patterns of silicon with thermal diffuse maxima around Kikuchi lines, which are analogs of the maxima of thermal diffuse electron scattering around point reflections, have been recorded. Diffuse maxima are observed only around Kikuchi lines with indices that are forbidden for the silicon structure. The diffraction conditions for forming these maxima are discussed.

Diffractive and coloured films by laser interferometry patterning

Czech Academy of Sciences Publication Activity Database

Peláez, R.J.; Afonso, C.N.; Bulíř, Jiří; Lančok, Ján; Novotný, Michal

2012-01-01

Roč. 211, Oct (2012), s. 205-208 ISSN 0257-8972 R&D Projects: GA AV ČR IAA100100718; GA ČR GP202/09/P324 Institutional research plan: CEZ:AV0Z10100522 Keywords : laser-patterning * metal * films * nanoparticles * diffraction * colour Subject RIV: BM - Solid Matter Physics ; Magnetism Impact factor: 1.941, year: 2012

Diffraction-based overlay for spacer patterning and double patterning technology

Science.gov (United States)

Lee, Byoung Hoon; Park, JeongSu; Lee, Jongsu; Park, Sarohan; Lim, ChangMoon; Yim, Dong-Gyu; Park, Sungki; Ryu, Chan-Ho; Morgan, Stephen; van de Schaar, Maurits; Fuchs, Andreas; Bhattacharyya, Kaustuve

2011-03-01

Overlay performance will be increasingly important for Spacer Patterning Technology (SPT) and Double Patterning Technology (DPT) as various Resolution Enhancement Techniques are employed to extend the resolution limits of lithography. Continuous shrinkage of devices makes overlay accuracy one of the most critical issues while overlay performance is completely dependent on exposure tool. Image Based Overlay (IBO) has been used as the mainstream metrology for overlay by the main memory IC companies, but IBO is not suitable for some critical layers due to the poor Tool Induced Shift (TIS) values. Hence new overlay metrology is required to improve the overlay measurement accuracy. Diffraction Based Overlay (DBO) is regarded to be an alternative metrology to IBO for more accurate measurements and reduction of reading errors. Good overlay performances of DBO have been reported in many articles. However applying DBO for SPT and DPT layers poses extra challenges for target design. New vernier designs are considered for different DPT and SPT schemes to meet overlay target in DBO system. In this paper, we optimize the design of the DBO target and the performance of DBO to meet the overlay specification of sub-3x nm devices which are using SPT and DPT processes. We show that the appropriate vernier design yields excellent overlay performance in residual and TIS. The paper also demonstrated the effects of vernier structure on overlay accuracy from SEM analysis.

Indexing amyloid peptide diffraction from serial femtosecond crystallography: new algorithms for sparse patterns

Energy Technology Data Exchange (ETDEWEB)

Brewster, Aaron S. [Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States); Sawaya, Michael R. [University of California, Los Angeles, CA 90095-1570 (United States); University of California, Los Angeles, CA 90095-1570 (United States); University of California, Los Angeles, CA 90095-1570 (United States); Rodriguez, Jose [University of California, Los Angeles, CA 90095-1570 (United States); University of California, Los Angeles, CA 90095-1570 (United States); Hattne, Johan; Echols, Nathaniel [Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States); McFarlane, Heather T. [University of California, Los Angeles, CA 90095-1570 (United States); University of California, Los Angeles, CA 90095-1570 (United States); Cascio, Duilio [University of California, Los Angeles, CA 90095-1570 (United States); University of California, Los Angeles, CA 90095-1570 (United States); University of California, Los Angeles, CA 90095-1570 (United States); Adams, Paul D. [Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States); University of California, Berkeley, CA 94720 (United States); Eisenberg, David S. [University of California, Los Angeles, CA 90095-1570 (United States); University of California, Los Angeles, CA 90095-1570 (United States); University of California, Los Angeles, CA 90095-1570 (United States); Sauter, Nicholas K., E-mail: nksauter@lbl.gov [Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States)

2015-02-01

Special methods are required to interpret sparse diffraction patterns collected from peptide crystals at X-ray free-electron lasers. Bragg spots can be indexed from composite-image powder rings, with crystal orientations then deduced from a very limited number of spot positions. Still diffraction patterns from peptide nanocrystals with small unit cells are challenging to index using conventional methods owing to the limited number of spots and the lack of crystal orientation information for individual images. New indexing algorithms have been developed as part of the Computational Crystallography Toolbox (cctbx) to overcome these challenges. Accurate unit-cell information derived from an aggregate data set from thousands of diffraction patterns can be used to determine a crystal orientation matrix for individual images with as few as five reflections. These algorithms are potentially applicable not only to amyloid peptides but also to any set of diffraction patterns with sparse properties, such as low-resolution virus structures or high-throughput screening of still images captured by raster-scanning at synchrotron sources. As a proof of concept for this technique, successful integration of X-ray free-electron laser (XFEL) data to 2.5 Å resolution for the amyloid segment GNNQQNY from the Sup35 yeast prion is presented.

Immobilization of biomolecules onto surfaces according to ultraviolet light diffraction patterns

DEFF Research Database (Denmark)

Petersen, Steffen B.; Gennaro, Ane Kold Di; Neves Petersen, Teresa

2010-01-01

We developed a method for immobilization of biomolecules onto thiol functionalized surfaces according to UV diffraction patterns. UV light-assisted molecular immobilization proceeds through the formation of free, reactive thiol groups that can bind covalently to thiol reactive surfaces. We demons......, with a fine structured interference pattern superimposed. (C) 2010 Optical Society of America...

Development of an ellipse fitting method with which to analyse selected area electron diffraction patterns

Energy Technology Data Exchange (ETDEWEB)

Mitchell, D.R.G., E-mail: dmitchel@uow.edu.au [Electron Microscopy Centre, Australian Institute for Innovative Materials, Innovation Campus, University of Wollongong, North Wollongong, NSW 2500 (Australia); Van den Berg, J.A. [Electron Microscopy Centre, Australian Institute for Innovative Materials, Innovation Campus, University of Wollongong, North Wollongong, NSW 2500 (Australia); Catalyst Fundamentals, Fischer-Tropsch and Syngas Conversion Research, Sasol Technology R & D, Sasolburg 1947 (South Africa)

2016-01-15

A software method has been developed which uses ellipse fitting to analyse electron diffraction patterns from polycrystalline materials. The method, which requires minimal user input, can determine the pattern centre and the diameter of diffraction rings with sub-pixel precision. This enables accurate crystallographic information to be obtained in a rapid and consistent manner. Since the method fits ellipses, it can detect, quantify and correct any elliptical distortion introduced by the imaging system. Distortion information derived from polycrystalline patterns as a function of camera length can be subsequently recalled and applied to single crystal patterns, resulting in improved precision and accuracy. The method has been implemented as a plugin for the DigitalMicrograph software by Gatan, and is a freely available via the internet. - Highlights: • A robust ellipse fitting method is developed. • Freely available software for automated diffraction pattern analysis is demonstrated. • Measurement and correction of elliptical distortion is routinely achieved.

X-ray diffraction patterns and diffracted intensity of Kα spectral lines of He-like ions

Science.gov (United States)

Goyal, Arun; Khatri, Indu; Singh, A. K.; Sharma, Rinku; Mohan, Man

2017-09-01

In the present paper, we have calculated fine-structure energy levels related to the configurations 1s2s, 1s2p, 1s3s and 1s3p by employing GRASP2K code. We have also computed radiative data for transitions from 1s2p 1 P1o, 1s2p 3 P2o, 1s2p 3 P1o and 1s2s 3S1 to the ground state 1s2. We have made comparisons of our presented energy levels and transition wavelengths with available results compiled by NIST and good agreement is achieved. We have also provided X-ray diffraction (XRD) patterns of Kα spectral lines, namely w, x, y and z of Cu XXVIII, Kr XXXV and Mo with diffraction angle and maximum diffracted intensity which is not published elsewhere in the literature. We believe that our presented results may be beneficial in determination of the order parameter, X-ray crystallography, solid-state drug analysis, forensic science, geological and medical applications.

Simulation of the diffraction pattern of one dimensional quasicrystal ...

African Journals Online (AJOL)

The effects of the variation of atomic spacing ratio of a one dimensional quasicrystal material are investigated. The work involves the use of the solid state simulation code, Laue written by Silsbee and Drager. We are able to observe the general features of the diffraction pattern by a quasicrystal. In addition, it has been found ...

Diffraction by m-bonacci gratings

International Nuclear Information System (INIS)

Monsoriu, Juan A; Giménez, Marcos H; Furlan, Walter D; Barreiro, Juan C; Saavedra, Genaro

2015-01-01

We present a simple diffraction experiment with m-bonacci gratings as a new interesting generalization of the Fibonacci ones. Diffraction by these non-conventional structures is proposed as a motivational strategy to introduce students to basic research activities. The Fraunhofer diffraction patterns are obtained with the standard equipment present in most undergraduate physics labs and are compared with those obtained with regular periodic gratings. We show that m-bonacci gratings produce discrete Fraunhofer patterns characterized by a set of diffraction peaks which positions are related to the concept of a generalized golden mean. A very good agreement is obtained between experimental and numerical results and the students’ feedback is discussed. (paper)

Dark-field imaging based on post-processed electron backscatter diffraction patterns of bulk crystalline materials in a scanning electron microscope.

Science.gov (United States)

Brodusch, Nicolas; Demers, Hendrix; Gauvin, Raynald

2015-01-01

Dark-field (DF) images were acquired in the scanning electron microscope with an offline procedure based on electron backscatter diffraction (EBSD) patterns (EBSPs). These EBSD-DF images were generated by selecting a particular reflection on the electron backscatter diffraction pattern and by reporting the intensity of one or several pixels around this point at each pixel of the EBSD-DF image. Unlike previous studies, the diffraction information of the sample is the basis of the final image contrast with a pixel scale resolution at the EBSP providing DF imaging in the scanning electron microscope. The offline facility of this technique permits the selection of any diffraction condition available in the diffraction pattern and displaying the corresponding image. The high number of diffraction-based images available allows a better monitoring of deformation structures compared to electron channeling contrast imaging (ECCI) which is generally limited to a few images of the same area. This technique was applied to steel and iron specimens and showed its high capability in describing more rigorously the deformation structures around micro-hardness indents. Due to the offline relation between the reference EBSP and the EBSD-DF images, this new technique will undoubtedly greatly improve our knowledge of deformation mechanism and help to improve our understanding of the ECCI contrast mechanisms. Copyright © 2014 Elsevier B.V. All rights reserved.

High-speed classification of coherent X-ray diffraction patterns on the K computer for high-resolution single biomolecule imaging

Energy Technology Data Exchange (ETDEWEB)

Tokuhisa, Atsushi [RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5148 (Japan); Arai, Junya [The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033 (Japan); Joti, Yasumasa [JASRI, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198 (Japan); Ohno, Yoshiyuki; Kameyama, Toyohisa; Yamamoto, Keiji; Hatanaka, Masayuki; Gerofi, Balazs; Shimada, Akio; Kurokawa, Motoyoshi; Shoji, Fumiyoshi [RIKEN Advanced Institute for Computational Science, 7-1-26 Minatojima-minami-machi, Chuo-ku, Kobe, Hyogo 650-0047 (Japan); Okada, Kensuke [RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5148 (Japan); Sugimoto, Takashi [JASRI, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198 (Japan); Yamaga, Mitsuhiro; Tanaka, Ryotaro [RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5148 (Japan); Yokokawa, Mitsuo; Hori, Atsushi [RIKEN Advanced Institute for Computational Science, 7-1-26 Minatojima-minami-machi, Chuo-ku, Kobe, Hyogo 650-0047 (Japan); Ishikawa, Yutaka, E-mail: ishikawa@is.s.u-tokyo.ac.jp [The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033 (Japan); Hatsui, Takaki, E-mail: ishikawa@is.s.u-tokyo.ac.jp [RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5148 (Japan); Go, Nobuhiro [Japan Atomic Energy Agency, 8-1-7 Umemidai, Kizugawa, Kyoto 619-0215 (Japan)

2013-11-01

A code with an algorithm for high-speed classification of X-ray diffraction patterns has been developed. Results obtained for a set of 1 × 10{sup 6} simulated diffraction patterns are also reported. Single-particle coherent X-ray diffraction imaging using an X-ray free-electron laser has the potential to reveal the three-dimensional structure of a biological supra-molecule at sub-nanometer resolution. In order to realise this method, it is necessary to analyze as many as 1 × 10{sup 6} noisy X-ray diffraction patterns, each for an unknown random target orientation. To cope with the severe quantum noise, patterns need to be classified according to their similarities and average similar patterns to improve the signal-to-noise ratio. A high-speed scalable scheme has been developed to carry out classification on the K computer, a 10PFLOPS supercomputer at RIKEN Advanced Institute for Computational Science. It is designed to work on the real-time basis with the experimental diffraction pattern collection at the X-ray free-electron laser facility SACLA so that the result of classification can be feedback for optimizing experimental parameters during the experiment. The present status of our effort developing the system and also a result of application to a set of simulated diffraction patterns is reported. About 1 × 10{sup 6} diffraction patterns were successfully classificatied by running 255 separate 1 h jobs in 385-node mode.

Koch fractals in physical optics and their Fraunhofer diffraction patterns

Czech Academy of Sciences Publication Activity Database

Horváth, P.; Šmíd, Petr; Vašková, I.; Hrabovský, M.

2010-01-01

Roč. 121, č. 2 (2010), s. 206-2134 ISSN 0030-4026 R&D Projects: GA MŠk(CZ) 1M06002 Institutional research plan: CEZ:AV0Z10100522 Keywords : Koch fractal s * Fraunhofer diffraction patterns Subject RIV: BH - Optics, Masers, Lasers Impact factor: 0.454, year: 2010

Electron diffraction from carbon nanotubes

International Nuclear Information System (INIS)

Qin, L-C

2006-01-01

The properties of a carbon nanotube are dependent on its atomic structure. The atomic structure of a carbon nanotube can be defined by specifying its chiral indices (u, v), that specify its perimeter vector (chiral vector), with which the diameter and helicity are also determined. The fine electron beam available in a modern transmission electron microscope (TEM) offers a unique probe to reveal the atomic structure of individual nanotubes. This review covers two aspects related to the use of the electron probe in the TEM for the study of carbon nanotubes: (a) to understand the electron diffraction phenomena for inter-pretation of the electron diffraction patterns of carbon nanotubes and (b) to obtain the chiral indices (u, v), of the carbon nanotubes from the electron diffraction patterns. For a nanotube of a given structure, the electron scattering amplitude from the carbon nanotube is first described analytically in closed form using the helical diffraction theory. From a known structure as given by the chiral indices (u, v), its electron diffraction pattern can be calculated and understood. The reverse problem, i.e. assignment of the chiral indices from an electron diffraction pattern of a carbon nanotube, is approached from the relationship between the electron scattering intensity distribution and the chiral indices (u, v). We show that electron diffraction patterns can provide an accurate and unambiguous assignment of the chiral indices of carbon nanotubes. The chiral indices (u, v) can be read indiscriminately with a high accuracy from the intensity distribution on the principal layer lines in an electron diffraction pattern. The symmetry properties of electron diffraction from carbon nanotubes and the electron diffraction from deformed carbon nanotubes are also discussed in detail. It is shown that 2mm symmetry is always preserved for single-walled carbon nanotubes, but it can break down for multiwalled carbon nanotubes under some special circumstances

X-ray diffraction patterns of metal aurocyanides

International Nuclear Information System (INIS)

Selig, W.S.; Smith, G.S.; Harding, K.K.; Summers, L.J.

1989-06-01

Aurocyanides of the following metal cations have been prepared: Ag, Hg(II), Ga, Fe(III), Tl(I), Bi, Pb, Mn(II), Ni, Zn, Cu(II), Cd, In, and Co(II). Most of the aurocyanides are of the type M[Au(CN) 2 ] x where M is the metal cation and x its valence. However, under some conditions mixed aurocyanides containing K may be formed, such as KCo[Au(CN) 2 ] 3 . Only Ag and Hg(II) form aurocyanides which are sufficiently insoluble for the potentiometric determination of the aurocyanide anion. The diffraction patterns of the various aurocyanides are reported. 12 refs., 16 tabs

Natural quasy-periodic binary structure with focusing property in near field diffraction pattern.

Science.gov (United States)

Mihailescu, Mona

2010-06-07

A naturally-inspired phase-only diffractive optical element with a circular symmetry given by a quasi-periodic structure of the phyllotaxis type is presented in this paper. It is generated starting with the characteristic parametric equations which are optimal for the golden angle interval. For some ideal geometrical parameters, the diffracted intensity distribution in near-field has a central closed ring with almost zero intensity inside. Its radius and intensity values depend on the geometry or non-binary phase distribution superposed onto the phyllotaxis geometry. Along propagation axis, the transverse diffraction patterns from the binary-phase diffractive structure exhibit a self-focusing behavior and a rotational motion.

A high-transparency, micro-patternable chip for X-ray diffraction analysis of microcrystals under native growth conditions

Energy Technology Data Exchange (ETDEWEB)

Murray, Thomas D. [University of California, Berkeley, CA 94720 (United States); Johns Hopkins University School of Medicine, Baltimore, MD 21205 (United States); Lyubimov, Artem Y. [Stanford University, Stanford, CA 94305 (United States); Ogata, Craig M. [Argonne National Laboratory, Argonne, IL 60439 (United States); Vo, Huy [Johns Hopkins University, Baltimore, MD 21205 (United States); Uervirojnangkoorn, Monarin; Brunger, Axel T., E-mail: brunger@stanford.edu [Stanford University, Stanford, CA 94305 (United States); Berger, James M., E-mail: brunger@stanford.edu [Johns Hopkins University School of Medicine, Baltimore, MD 21205 (United States); University of California, Berkeley, CA 94720 (United States)

2015-09-26

A highly X-ray-transparent, silicon nitride-based device has been designed and fabricated to harvest protein microcrystals for high-resolution X-ray diffraction data collection using microfocus beamlines and XFELs. Microcrystals present a significant impediment to the determination of macromolecular structures by X-ray diffraction methods. Although microfocus synchrotron beamlines and X-ray free-electron lasers (XFELs) can enable the collection of interpretable diffraction data from microcrystals, there is a need for efficient methods of harvesting small volumes (<2 µl) of microcrystals grown under common laboratory formats and delivering them to an X-ray beam source under native growth conditions. One approach that shows promise in overcoming the challenges intrinsic to microcrystal analysis is to pair so-called ‘fixed-target’ sample-delivery devices with microbeam-based X-ray diffraction methods. However, to record weak diffraction patterns it is necessary to fabricate devices from X-ray-transparent materials that minimize background scattering. Presented here is the design of a new micro-diffraction device consisting of three layers fabricated from silicon nitride, photoresist and polyimide film. The chip features low X-ray scattering and X-ray absorption properties, and uses a customizable blend of hydrophobic and hydrophilic surface patterns to help localize microcrystals to defined regions. Microcrystals in their native growth conditions can be loaded into the chips with a standard pipette, allowing data collection at room temperature. Diffraction data collected from hen egg-white lysozyme microcrystals (10–15 µm) loaded into the chips yielded a complete, high-resolution (<1.6 Å) data set sufficient to determine a high-quality structure by molecular replacement. The features of the chip allow the rapid and user-friendly analysis of microcrystals grown under virtually any laboratory format at microfocus synchrotron beamlines and XFELs.

A high-transparency, micro-patternable chip for X-ray diffraction analysis of microcrystals under native growth conditions

International Nuclear Information System (INIS)

Murray, Thomas D.; Lyubimov, Artem Y.; Ogata, Craig M.; Vo, Huy; Uervirojnangkoorn, Monarin; Brunger, Axel T.; Berger, James M.

2015-01-01

A highly X-ray-transparent, silicon nitride-based device has been designed and fabricated to harvest protein microcrystals for high-resolution X-ray diffraction data collection using microfocus beamlines and XFELs. Microcrystals present a significant impediment to the determination of macromolecular structures by X-ray diffraction methods. Although microfocus synchrotron beamlines and X-ray free-electron lasers (XFELs) can enable the collection of interpretable diffraction data from microcrystals, there is a need for efficient methods of harvesting small volumes (<2 µl) of microcrystals grown under common laboratory formats and delivering them to an X-ray beam source under native growth conditions. One approach that shows promise in overcoming the challenges intrinsic to microcrystal analysis is to pair so-called ‘fixed-target’ sample-delivery devices with microbeam-based X-ray diffraction methods. However, to record weak diffraction patterns it is necessary to fabricate devices from X-ray-transparent materials that minimize background scattering. Presented here is the design of a new micro-diffraction device consisting of three layers fabricated from silicon nitride, photoresist and polyimide film. The chip features low X-ray scattering and X-ray absorption properties, and uses a customizable blend of hydrophobic and hydrophilic surface patterns to help localize microcrystals to defined regions. Microcrystals in their native growth conditions can be loaded into the chips with a standard pipette, allowing data collection at room temperature. Diffraction data collected from hen egg-white lysozyme microcrystals (10–15 µm) loaded into the chips yielded a complete, high-resolution (<1.6 Å) data set sufficient to determine a high-quality structure by molecular replacement. The features of the chip allow the rapid and user-friendly analysis of microcrystals grown under virtually any laboratory format at microfocus synchrotron beamlines and XFELs

Visible diffraction from quasi-crystalline arrays of carbon nanotubes

Science.gov (United States)

Butler, Timothy P.; Butt, Haider; Wilkinson, Timothy D.; Amaratunga, Gehan A. J.

2015-08-01

Large area arrays of vertically-aligned carbon nanotubes (VACNTs) are patterned in a quasi-crystalline Penrose tile arrangement through electron beam lithography definition of Ni catalyst dots and subsequent nanotube growth by plasma-enhanced chemical vapour deposition. When illuminated with a 532 nm laser beam high-quality and remarkable diffraction patterns are seen. The diffraction is well matched to theoretical calculations which assume apertures to be present at the location of the VACNTs for transmitted light. The results show that VACNTs act as diffractive elements in reflection and can be used as spatially phased arrays for producing tailored diffraction patterns.

X-ray diffraction patterns in high-energy proton implanted silicon

International Nuclear Information System (INIS)

Wieteska, K.; Dluzewska, K.D.; Wierzchowski, W.; Graeff, W.

1998-01-01

Silicon crystals implanted with 1 and 1.6 MeV protons were studied by means of conventional source double-crystal and synchrotron multi-crystal arrangements. Both the rocking curves and series of topographs were recorded in different parallel settings employing different reflections and wavelengths of radiation. A comparison of rocking curves in different regions of implanted areas was performed in synchrotron multi-crystal arrangement with a beam of a very small diameter. The rocking curves exhibited subsidiary interference maxima with increasing periodicity on the low angle side. The plane wave topographs taken at different angular setting revealed characteristic fringes whose number decreased with increasing distance from the main maximum. The fringe pattern did not depend on the direction of the diffraction vector. The number of fringes for equivalent angular distance from the maximum was larger for higher order of reflection. The shape of the rocking curve and other diffraction patterns were reasonably explained assuming the lattice parameter change depth distribution proportional to the profile obtained from the Biersack-Ziegler theory and lateral non-uniformity of ion dose. A good approximation of the experimental results was obtained using numerical integration of the Takagi-Taupin equations. (orig.)

High quality single shot diffraction patterns using ultrashort megaelectron volt electron beams from a radio frequency photoinjector

Energy Technology Data Exchange (ETDEWEB)

Musumeci, P.; Moody, J. T.; Scoby, C. M.; Gutierrez, M. S. [Department of Physics and Astronomy, UCLA, Los Angeles, California 90095 (United States); Bender, H. A.; Wilcox, N. S. [National Security Technologies, LLC, Los Alamos Operations, Los Alamos, New Mexico 87544 (United States)

2010-01-15

Single shot diffraction patterns using a 250-fs-long electron beam have been obtained at the UCLA Pegasus laboratory. High quality images with spatial resolution sufficient to distinguish closely spaced peaks in the Debye-Scherrer ring pattern have been recorded by scattering the 1.6 pC 3.5 MeV electron beam generated in the rf photoinjector off a 100-nm-thick Au foil. Dark current and high emittance particles are removed from the beam before sending it onto the diffraction target using a 1 mm diameter collimating hole. These results open the door to the study of irreversible phase transformations by single shot MeV electron diffraction.

High quality single shot diffraction patterns using ultrashort megaelectron volt electron beams from a radio frequency photoinjector.

Science.gov (United States)

Musumeci, P; Moody, J T; Scoby, C M; Gutierrez, M S; Bender, H A; Wilcox, N S

2010-01-01

Single shot diffraction patterns using a 250-fs-long electron beam have been obtained at the UCLA Pegasus laboratory. High quality images with spatial resolution sufficient to distinguish closely spaced peaks in the Debye-Scherrer ring pattern have been recorded by scattering the 1.6 pC 3.5 MeV electron beam generated in the rf photoinjector off a 100-nm-thick Au foil. Dark current and high emittance particles are removed from the beam before sending it onto the diffraction target using a 1 mm diameter collimating hole. These results open the door to the study of irreversible phase transformations by single shot MeV electron diffraction.

High quality single shot diffraction patterns using ultrashort megaelectron volt electron beams from a radio frequency photoinjector

International Nuclear Information System (INIS)

Musumeci, P.; Moody, J. T.; Scoby, C. M.; Gutierrez, M. S.; Bender, H. A.; Wilcox, N. S.

2010-01-01

Single shot diffraction patterns using a 250-fs-long electron beam have been obtained at the UCLA Pegasus laboratory. High quality images with spatial resolution sufficient to distinguish closely spaced peaks in the Debye-Scherrer ring pattern have been recorded by scattering the 1.6 pC 3.5 MeV electron beam generated in the rf photoinjector off a 100-nm-thick Au foil. Dark current and high emittance particles are removed from the beam before sending it onto the diffraction target using a 1 mm diameter collimating hole. These results open the door to the study of irreversible phase transformations by single shot MeV electron diffraction.

Improved orientation sampling for indexing diffraction patterns of polycrystalline materials

DEFF Research Database (Denmark)

Larsen, Peter Mahler; Schmidt, Søren

2017-01-01

to that of optimally distributing points on a four‐dimensional sphere. In doing so, the number of orientation samples needed to achieve a desired indexing accuracy is significantly reduced. Orientation sets at a range of sizes are generated in this way for all Laue groups and are made available online for easy use.......Orientation mapping is a widely used technique for revealing the microstructure of a polycrystalline sample. The crystalline orientation at each point in the sample is determined by analysis of the diffraction pattern, a process known as pattern indexing. A recent development in pattern indexing...... in the presence of noise, it has very high computational requirements. In this article, the computational burden is reduced by developing a method for nearly optimal sampling of orientations. By using the quaternion representation of orientations, it is shown that the optimal sampling problem is equivalent...

High resolution electron exit wave reconstruction from a diffraction pattern using Gaussian basis decomposition

International Nuclear Information System (INIS)

Borisenko, Konstantin B; Kirkland, Angus I

2014-01-01

We describe an algorithm to reconstruct the electron exit wave of a weak-phase object from single diffraction pattern. The algorithm uses analytic formulations describing the diffraction intensities through a representation of the object exit wave in a Gaussian basis. The reconstruction is achieved by solving an overdetermined system of non-linear equations using an easily parallelisable global multi-start search with Levenberg-Marquard optimisation and analytic derivatives

ZDS - a computer program for analysis of X-ray powder diffraction patterns

International Nuclear Information System (INIS)

Ondrus, P.

1993-01-01

The ZDS system creates an integrated environment of procedures for complete and precise analysis of raw powder diffraction patterns. The basis of the ZDS system is a graphic control centre for easy and user-friendly application of all included procedures. It offers a number of application procedures without an interaction with any data base. The program operates either in an automatic or manual mode. The manual mode makes possible specialized applications. The input and output of the data are compatible with Philips and Siemens powder diffraction software. The ZDS system runs with Intel 80286 or 80386-based PC computers with or without math-coprocesor. (orig.)

Numerical comparison of grid pattern diffraction effects through measurement and modeling with OptiScan software

Science.gov (United States)

Murray, Ian B.; Densmore, Victor; Bora, Vaibhav; Pieratt, Matthew W.; Hibbard, Douglas L.; Milster, Tom D.

2011-06-01

Coatings of various metalized patterns are used for heating and electromagnetic interference (EMI) shielding applications. Previous work has focused on macro differences between different types of grids, and has shown good correlation between measurements and analyses of grid diffraction. To advance this work, we have utilized the University of Arizona's OptiScan software, which has been optimized for this application by using the Babinet Principle. When operating on an appropriate computer system, this algorithm produces results hundreds of times faster than standard Fourier-based methods, and allows realistic cases to be modeled for the first time. By using previously published derivations by Exotic Electro-Optics, we compare diffraction performance of repeating and randomized grid patterns with equivalent sheet resistance using numerical performance metrics. Grid patterns of each type are printed on optical substrates and measured energy is compared against modeled energy.

Orientation effects on indexing of electron backscatter diffraction patterns

International Nuclear Information System (INIS)

Nowell, Matthew M.; Wright, Stuart I.

2005-01-01

Automated Electron Backscatter Diffraction (EBSD) has become a well-accepted technique for characterizing the crystallographic orientation aspects of polycrystalline microstructures. At the advent of this technique, it was observed that patterns obtained from grains in certain crystallographic orientations were more difficult for the automated indexing algorithms to accurately identify than patterns from other orientations. The origin of this problem is often similarities between the EBSD pattern of the correct orientation and patterns from other orientations or phases. While practical solutions have been found and implemented, the identification of these problem orientations generally occurs only after running an automated scan, as problem orientations are often readily apparent in the resulting orientation maps. However, such an approach only finds those problem orientations that are present in the scan area. It would be advantageous to identify all regions of orientation space that may present problems for automated indexing prior to initiating an automated scan, and to minimize this space through the optimization of acquisition and indexing parameters. This work presents new methods for identifying regions in orientation space where the reliability of the automated indexing is suspect prior to performing a scan. This methodology is used to characterize the impact of various parameters on the indexing algorithm

A deep convolutional neural network to analyze position averaged convergent beam electron diffraction patterns.

Science.gov (United States)

Xu, W; LeBeau, J M

2018-05-01

We establish a series of deep convolutional neural networks to automatically analyze position averaged convergent beam electron diffraction patterns. The networks first calibrate the zero-order disk size, center position, and rotation without the need for pretreating the data. With the aligned data, additional networks then measure the sample thickness and tilt. The performance of the network is explored as a function of a variety of variables including thickness, tilt, and dose. A methodology to explore the response of the neural network to various pattern features is also presented. Processing patterns at a rate of  ∼ 0.1 s/pattern, the network is shown to be orders of magnitude faster than a brute force method while maintaining accuracy. The approach is thus suitable for automatically processing big, 4D STEM data. We also discuss the generality of the method to other materials/orientations as well as a hybrid approach that combines the features of the neural network with least squares fitting for even more robust analysis. The source code is available at https://github.com/subangstrom/DeepDiffraction. Copyright © 2018 Elsevier B.V. All rights reserved.

X-ray diffraction identification of clay minerals by microcomputer

International Nuclear Information System (INIS)

Rodrigues, S.; Imasava, F.J.

1988-01-01

The identification of clay minerals by X-ray powder diffraction are done by searching an unknown pattern with a file of standard X-ray diffraction patterns. For this searching done by hand is necessary a long time. This paper shows a program in ''Basic'' language to be utilized in microcomputers for the math of the unknown pattern, using the high velocity of comparison of the microcomputer. A few minutes are used for the match. (author) [pt

Pattern formation without diffraction matching in optical parametric oscillators with a metamaterial.

Science.gov (United States)

Tassin, Philippe; Van der Sande, Guy; Veretennicoff, Irina; Kockaert, Pascal; Tlidi, Mustapha

2009-05-25

We consider a degenerate optical parametric oscillator containing a left-handed material. We show that the inclusion of a left-handed material layer allows for controlling the strength and sign of the diffraction coefficient at either the pump or the signal frequency. Subsequently, we demonstrate the existence of stable dissipative structures without diffraction matching, i.e., without the usual relationship between the diffraction coefficients of the signal and pump fields. Finally, we investigate the size scaling of these light structures with decreasing diffraction strength.

Classifying and assembling two-dimensional X-ray laser diffraction patterns of a single particle to reconstruct the three-dimensional diffraction intensity function: resolution limit due to the quantum noise

International Nuclear Information System (INIS)

Tokuhisa, Atsushi; Taka, Junichiro; Kono, Hidetoshi; Go, Nobuhiro

2012-01-01

A new algorithm is developed for reconstructing the high-resolution three-dimensional diffraction intensity function of a globular biological macromolecule from many quantum-noise-limited two-dimensional X-ray laser diffraction patterns, each for an unknown orientation. The structural resolution is expressed as a function of the incident X-ray intensity and quantities characterizing the target molecule. A new two-step algorithm is developed for reconstructing the three-dimensional diffraction intensity of a globular biological macromolecule from many experimentally measured quantum-noise-limited two-dimensional X-ray laser diffraction patterns, each for an unknown orientation. The first step is classification of the two-dimensional patterns into groups according to the similarity of direction of the incident X-rays with respect to the molecule and an averaging within each group to reduce the noise. The second step is detection of common intersecting circles between the signal-enhanced two-dimensional patterns to identify their mutual location in the three-dimensional wavenumber space. The newly developed algorithm enables one to detect a signal for classification in noisy experimental photon-count data with as low as ∼0.1 photons per effective pixel. The wavenumber of such a limiting pixel determines the attainable structural resolution. From this fact, the resolution limit due to the quantum noise attainable by this new method of analysis as well as two important experimental parameters, the number of two-dimensional patterns to be measured (the load for the detector) and the number of pairs of two-dimensional patterns to be analysed (the load for the computer), are derived as a function of the incident X-ray intensity and quantities characterizing the target molecule

Generation of mask patterns for diffractive optical elements using MathematicaTM

International Nuclear Information System (INIS)

OShea, D.C.

1996-01-01

The generation of binary and grayscale masks used in the fabrication of diffractive optical elements is usually performed using a proprietary piece of software or a computer-aided drafting package. Once the pattern is computed or designed, it must be output to a plotting or imaging system that will produce a reticle plate. This article describes a number of short Mathematica modules that can be used to generate binary and grayscale patterns in a PostScript-compatible format. Approaches to ensure that the patterns are directly related to the function of the element and the design wavelength are discussed. A procedure to preserve the scale of the graphic output when it is transferred to another application is given. Examples of surfaces for a 100 mm effective focal length lens and an Alvarez surface are given. copyright 1996 American Institute of Physics

Atomic resolution three-dimensional electron diffraction microscopy

International Nuclear Information System (INIS)

Miao Jianwei; Ohsuna, Tetsu; Terasaki, Osamu; Hodgson, Keith O.; O'Keefe, Michael A.

2002-01-01

We report the development of a novel form of diffraction-based 3D microscopy to overcome resolution barriers inherent in high-resolution electron microscopy and tomography. By combining coherent electron diffraction with the oversampling phasing method, we show that the 3D structure of a nanocrystal can be determined ab initio at a resolution of 1 Angstrom from 29 simulated noisy diffraction patterns. This new form of microscopy can be used to image the 3D structures of nanocrystals and noncrystalline samples, with resolution limited only by the quality of sample diffraction

Determination of the Projected Atomic Potential by Deconvolution of the Auto-Correlation Function of TEM Electron Nano-Diffraction Patterns

Directory of Open Access Journals (Sweden)

Liberato De Caro

2016-11-01

Full Text Available We present a novel method to determine the projected atomic potential of a specimen directly from transmission electron microscopy coherent electron nano-diffraction patterns, overcoming common limitations encountered so far due to the dynamical nature of electron-matter interaction. The projected potential is obtained by deconvolution of the inverse Fourier transform of experimental diffraction patterns rescaled in intensity by using theoretical values of the kinematical atomic scattering factors. This novelty enables the compensation of dynamical effects typical of transmission electron microscopy (TEM experiments on standard specimens with thicknesses up to a few tens of nm. The projected atomic potentials so obtained are averaged on sample regions illuminated by nano-sized electron probes and are in good quantitative agreement with theoretical expectations. Contrary to lens-based microscopy, here the spatial resolution in the retrieved projected atomic potential profiles is related to the finer lattice spacing measured in the electron diffraction pattern. The method has been successfully applied to experimental nano-diffraction data of crystalline centrosymmetric and non-centrosymmetric specimens achieving a resolution of 65 pm.

Study of optical Laue diffraction

International Nuclear Information System (INIS)

Chakravarthy, Giridhar; Allam, Srinivasa Rao; Satyanarayana, S. V. M.; Sharan, Alok

2014-01-01

We present the study of the optical diffraction pattern of one and two-dimensional gratings with defects, designed using desktop pc and printed on OHP sheet using laser printer. Gratings so prepared, using novel low cost technique provides good visual aid in teaching. Diffraction pattern of the monochromatic light (632.8nm) from the grating so designed is similar to that of x-ray diffraction pattern of crystal lattice with point defects in one and two-dimensions. Here both optical and x-ray diffractions are Fraunhofer. The information about the crystalline lattice structure and the defect size can be known

Study of optical Laue diffraction

Energy Technology Data Exchange (ETDEWEB)

Chakravarthy, Giridhar, E-mail: cgiridhar84@gmail.com, E-mail: aloksharan@email.com; Allam, Srinivasa Rao, E-mail: cgiridhar84@gmail.com, E-mail: aloksharan@email.com; Satyanarayana, S. V. M., E-mail: cgiridhar84@gmail.com, E-mail: aloksharan@email.com; Sharan, Alok, E-mail: cgiridhar84@gmail.com, E-mail: aloksharan@email.com [Department of Physics, Pondicherry University, Puducherry-605014 (India)

2014-10-15

We present the study of the optical diffraction pattern of one and two-dimensional gratings with defects, designed using desktop pc and printed on OHP sheet using laser printer. Gratings so prepared, using novel low cost technique provides good visual aid in teaching. Diffraction pattern of the monochromatic light (632.8nm) from the grating so designed is similar to that of x-ray diffraction pattern of crystal lattice with point defects in one and two-dimensions. Here both optical and x-ray diffractions are Fraunhofer. The information about the crystalline lattice structure and the defect size can be known.

An efficient and novel computation method for simulating diffraction patterns from large-scale coded apertures on large-scale focal plane arrays

Science.gov (United States)

Shrekenhamer, Abraham; Gottesman, Stephen R.

2012-10-01

A novel and memory efficient method for computing diffraction patterns produced on large-scale focal planes by largescale Coded Apertures at wavelengths where diffraction effects are significant has been developed and tested. The scheme, readily implementable on portable computers, overcomes the memory limitations of present state-of-the-art simulation codes such as Zemax. The method consists of first calculating a set of reference complex field (amplitude and phase) patterns on the focal plane produced by a single (reference) central hole, extending to twice the focal plane array size, with one such pattern for each Line-of-Sight (LOS) direction and wavelength in the scene, and with the pattern amplitude corresponding to the square-root of the spectral irradiance from each such LOS direction in the scene at selected wavelengths. Next the set of reference patterns is transformed to generate pattern sets for other holes. The transformation consists of a translational pattern shift corresponding to each hole's position offset and an electrical phase shift corresponding to each hole's position offset and incoming radiance's direction and wavelength. The set of complex patterns for each direction and wavelength is then summed coherently and squared for each detector to yield a set of power patterns unique for each direction and wavelength. Finally the set of power patterns is summed to produce the full waveband diffraction pattern from the scene. With this tool researchers can now efficiently simulate diffraction patterns produced from scenes by large-scale Coded Apertures onto large-scale focal plane arrays to support the development and optimization of coded aperture masks and image reconstruction algorithms.

Advanced diffraction-based overlay for double patterning

Science.gov (United States)

Li, Jie; Liu, Yongdong; Dasari, Prasad; Hu, Jiangtao; Smith, Nigel; Kritsun, Oleg; Volkman, Catherine

2010-03-01

Diffraction based overlay (DBO) technologies have been developed to address the tighter overlay control challenges as the dimensions of integrated circuit continue to shrink. Several studies published recently have demonstrated that the performance of DBO technologies has the potential to meet the overlay metrology budget for 22nm technology node. However, several hurdles must be cleared before DBO can be used in production. One of the major hurdles is that most DBO technologies require specially designed targets that consist of multiple measurement pads, which consume too much space and increase measurement time. A more advanced spectroscopic ellipsometry (SE) technology-Mueller Matrix SE (MM-SE) is developed to address the challenge. We use a double patterning sample to demonstrate the potential of MM-SE as a DBO candidate. Sample matrix (the matrix that describes the effects of the sample on the incident optical beam) obtained from MM-SE contains up to 16 elements. We show that the Mueller elements from the off-diagonal 2x2 blocks respond to overlay linearly and are zero when overlay errors are absent. This superior property enables empirical DBO (eDBO) using two pads per direction. Furthermore, the rich information in Mueller matrix and its direct response to overlay make it feasible to extract overlay errors from only one pad per direction using modeling approach (mDBO). We here present the Mueller overlay results using both eDBO and mDBO and compare the results with image-based overlay (IBO) and CD-SEM results. We also report the tool induced shifts (TIS) and dynamic repeatability.

Diffractive optical devices produced by light-assisted trapping of nanoparticles.

Science.gov (United States)

Muñoz-Martínez, J F; Jubera, M; Matarrubia, J; García-Cabañes, A; Agulló-López, F; Carrascosa, M

2016-01-15

One- and two-dimensional diffractive optical devices have been fabricated by light-assisted trapping and patterning of nanoparticles. The method is based on the dielectrophoretic forces appearing in the vicinity of a photovoltaic crystal, such as Fe:LiNbO3, during or after illumination. By illumination with the appropriate light distribution, the nanoparticles are organized along patterns designed at will. One- and two-dimensional diffractive components have been achieved on X- and Z-cut Fe:LiNbO3 crystals, with their polar axes parallel and perpendicular to the crystal surface, respectively. Diffraction gratings with periods down to around a few micrometers have been produced using metal (Al, Ag) nanoparticles with radii in the range of 70-100 nm. Moreover, several 2D devices, such as Fresnel zone plates, have been also produced showing the potential of the method. The diffractive particle patterns remain stable when light is removed. A method to transfer the diffractive patterns to other nonphotovoltaic substrates, such as silica glass, has been also reported.

The crystal structures and powder diffraction patterns of the uranium tellurides

Energy Technology Data Exchange (ETDEWEB)

Snyder, R.L. (State Univ. of New York, Alfred, NY (USA). Inst. of Ceramic Superconductivity); Nichols, M.C.; Boehme, D.R. (Sandia National Labs., Livermore, CA (USA))

1990-10-03

A critical review of all of the reported structures and powder diffraction patterns in the uranium telluride system has been undertaken. Structures that are correct: Cubic -- UTe: no experimental pattern exists. Retain calculated 15--865. Cubic --U{sub 3}Te{sub 4}: retain the poor quality 12--610 but adopt the pattern calculated here. Cubic U{sub 2}Te{sub 3}: no experimental pattern exists. Adopt pattern calculated here. Orthorhombic UTe{sub 2}: Adopt the new pattern of Boehme et al. Monoclinic {alpha}UTe{sub 3} Adopt the new pattern of Boehme et al. Monoclinic {alpha}UTe{sub 3} Adopt the new pattern of Boehme et al. Orthorhombic {beta}UTe{sub 3}: Adopt pattern calculated here. Orthorhombic UTe{sub 5}: Adopt the new pattern of Boehme et al. Structures in need of refinement: Orthorhombic U{sub 2}Te{sub 3}:Adopt pattern calculated here over 34--807. Hexagonal U{sub 7}Te{sub 12}: Adopt pattern calculated here but retain 24--1368. Orthorhombic UTe{sub 1.78}: Adopt pattern calculated here and retain our modified 21--1404 reported for U{sub 4}Te{sub 7}. Orthorhombic UTe{sub 2.5}: Adopt pattern calculated here. Orthorhombic UTe{sub 3.4}: Accept recent pattern of Boehme et al. Phases for which no structures or reliable patterns exist: Orthorhombic U{sub 3}Te{sub 4}: no published pattern. Tetragonal U{sub 3}Te{sub 5}: three patterns 21--1407, 34--766 and 34--896 exit but all are of very poor quality. Phases which probably do not exist: Tetragonal UTe{sub 1.78}, Tetragonal UTe{sub 2}, Cubic UTe{sub 2} U{sub 3}Te{sub 7}(21--1402), U{sub 3}Te{sub 8}(21--1406).

Contrast of HOLZ lines in energy-filtered convergent-beam electron diffraction patterns from silicon

International Nuclear Information System (INIS)

Lehmpfuhl, G.; Krahl, D.; Uchida, Y.

1995-01-01

Higher-order Laue-zone (HOLZ) lines were investigated in convergent-beam electron diffraction patterns from silicon near the low-indexed zone axes [100], [110] and [111]. The visibility of these lines depends on the effective structure potentials of the reflections from the first Laue zone depending on their Debye-Waller factor. The contrast of the HOLZ lines is strongly reduced by inelastically scattered electrons. They can be excluded by an imaging Ω filter for energy losses above 2 eV. The diffraction patterns were compared with many-beam calculations. Without absorption, an excellent agreement could be achieved for the [111] and [100] zone axes, while the simulation of the [110] zone-axis pattern needed a calculation with absorption. The reason for this observation is explained in the Bloch-wave picture. Calculations with absorption, however, lead to artefacts in the intensity distribution of the [100] HOLZ pattern. In order to obtain agreement with the experiment, the Debye-Waller factor had to be modified in different ways for the different zone axes. This corresponds to a strong anisotropy of the Debye-Waller factor. To confirm this observation, the temperature dependence of the itensity distributions of the HOLZ patterns was investigated between 50 and 680 K. At room temperature, the parameter D in the Debye-Waller factor exp(-Ds 2 ) was determined as 0.13, 0.26 and 0.55 A 2 for the zone axes [100], [111] and [110], respectively. The reliability of the conclusions is discussed. (orig.)

Reaching (sub-)micrometer resolution of photo-immobilized proteins using diffracted light beams

DEFF Research Database (Denmark)

Skovsen, Esben; Neves Petersen, Teresa; Petersen, Steffen B.

2008-01-01

, with dimensions as small as a few micrometers. The ultimate size of the immobilized spots is dependent on the focal area of the UV beam. The technology involves light induced formation of free, reactive thiol groups in molecules containing aromatic residues nearby disulphide bridges. It is not only limited...... to immobilizing molecules according to conventional patterns like microarrays, as any bitmap motif can virtually be used a template for patterning. We now show that molecules (proteins) can be immobilized on a surface with any arbitrary pattern according to diffraction patterns of light. The pattern of photo......-immobilized proteins reproduces the diffraction pattern of light expected with the optical setup. Immobilising biomolecules according to diffraction patterns of light will allow achievement of smaller patterns with higher resolution. The flexibility of this new technology leads to any patterns of photo...

Analysis of XFEL serial diffraction data from individual crystalline fibrils

Directory of Open Access Journals (Sweden)

David H. Wojtas

2017-11-01

Full Text Available Serial diffraction data collected at the Linac Coherent Light Source from crystalline amyloid fibrils delivered in a liquid jet show that the fibrils are well oriented in the jet. At low fibril concentrations, diffraction patterns are recorded from single fibrils; these patterns are weak and contain only a few reflections. Methods are developed for determining the orientation of patterns in reciprocal space and merging them in three dimensions. This allows the individual structure amplitudes to be calculated, thus overcoming the limitations of orientation and cylindrical averaging in conventional fibre diffraction analysis. The advantages of this technique should allow structural studies of fibrous systems in biology that are inaccessible using existing techniques.

When fast atom diffraction turns 3D

International Nuclear Information System (INIS)

Zugarramurdi, Asier; Borisov, Andrei G.

2013-01-01

Fast atom diffraction at surfaces (FAD) in grazing incidence geometry is characterized by the slow motion in the direction perpendicular to the surface and fast motion parallel to the surface plane along a low index direction. It is established experimentally that for the typical surfaces the FAD reveals the 2D diffraction patterns associated with exchange of the reciprocal lattice vector perpendicular to the direction of fast motion. The reciprocal lattice vector exchange along the direction of fast motion is negligible. The usual approximation made in the description of the experimental data is then to assume that the effective potential leading to the diffraction results from the averaging of the 3D surface potential along the atomic strings forming the axial channel. In this work we use full quantum wave packet propagation calculations to study theoretically the possibility to observe the 3D diffraction in FAD experiments. We show that for the surfaces with large unit cell, such as can be the case for reconstructed or vicinal surfaces, the 3D diffraction can be observed. The reciprocal lattice vector exchange along the direction of fast motion leads to several Laue circles in the diffraction pattern

Quantum diffraction and interference of spatially correlated photon pairs and its Fourier-optical analysis

International Nuclear Information System (INIS)

Shimizu, Ryosuke; Edamatsu, Keiichi; Itoh, Tadashi

2006-01-01

We present one- and two-photon diffraction and interference experiments involving parametric down-converted photon pairs. By controlling the divergence of the pump beam in parametric down-conversion, the diffraction-interference pattern produced by an object changes from a quantum (perfectly correlated) case to a classical (uncorrelated) one. The observed diffraction and interference patterns are accurately reproduced by Fourier-optical analysis taking into account the quantum spatial correlation. We show that the relation between the spatial correlation and the object size plays a crucial role in the formation of both one- and two-photon diffraction-interference patterns

Diffraction contrast imaging using virtual apertures

International Nuclear Information System (INIS)

Gammer, Christoph; Burak Ozdol, V.; Liebscher, Christian H.; Minor, Andrew M.

2015-01-01

Two methods on how to obtain the full diffraction information from a sample region and the associated reconstruction of images or diffraction patterns using virtual apertures are demonstrated. In a STEM-based approach, diffraction patterns are recorded for each beam position using a small probe convergence angle. Similarly, a tilt series of TEM dark-field images is acquired. The resulting datasets allow the reconstruction of either electron diffraction patterns, or bright-, dark- or annular dark-field images using virtual apertures. The experimental procedures of both methods are presented in the paper and are applied to a precipitation strengthened and creep deformed ferritic alloy with a complex microstructure. The reconstructed virtual images are compared with conventional TEM images. The major advantage is that arbitrarily shaped virtual apertures generated with image processing software can be designed without facing any physical limitations. In addition, any virtual detector that is specifically designed according to the underlying crystal structure can be created to optimize image contrast. - Highlights: • A dataset containing all structural information of a given position is recorded. • The dataset allows reconstruction of virtual diffraction patterns or images. • Specific virtual apertures are designed to image precipitates in a complex alloy. • Virtual diffraction patterns from arbitrarily small regions can be established. • Using STEM diffraction to record the dataset is more efficient than TEM dark-field

Computer x-ray powder diffraction patterns and densities for corundum, aluminium, zirconium, delta-UZr2 and the zirconium hydrides

International Nuclear Information System (INIS)

Ferguson, I.F.

1976-11-01

The computer-calculated X-ray powder diffraction patterns and theoretical densities of α-Al 2 O 3 ; Al; α-Zr; β-Zr; delta-UZr 2 ; γ, delta - and epsilon-zirconium hydrides are presented. Brief comments are given on some of the published X-ray powder diffraction data on these phases. (author)

Calculation of diffraction patterns associated with electron irradiation induced amorphization of CuTi

International Nuclear Information System (INIS)

Devanathan, R.; Meshii, M.; Sabochik, M.J.

1990-11-01

A new approach that uses the multislice method in conjunction with molecular dynamics simulations to study electron irradiation induced amorphisation is presented. Diffraction patterns were calculated for CuTi and found to be more sensitive than the pair correlation function to the structural changes preceding amorphisation. The results from this approach and from a study of long range order are presented. 16 refs., 8 figs

Borehole radar diffraction tomography

Energy Technology Data Exchange (ETDEWEB)

Cho, Seong Jun; Kim, Jung Ho; Yi, Myeong Jong; Chung, Seung Hwan; Lee, Hee Il [Korea Institute of Geology Mining and Materials, Taejon (Korea, Republic of)

1997-12-01

Tomography is widely used as imaging method for determining subsurface structure. Among the reconstruction algorithms for tomographic imaging, travel time tomography is almost applied to imaging subsurface. But isolated small body comparable with the wavelength could not be well recognized by travel time tomography. Other tomographic method are need to improve the imaging process. In the study of this year, diffraction tomography was investigated. The theory for diffraction tomography is based on the 1st-order Born approximation. Multisource holography, which is similar to Kirchihoff migration, is compared with diffraction tomography. To improve 1st-order Born diffraction tomography, two kinds of filter designed from multisource holography and 2-D green function, respectively, applied on the reconstructed image. The algorithm was tested for the numerical modeling data of which algorithm consists of the analytic computation of radar signal in transmitter and receiver regions and 2-D FDM scheme for the propagation of electromagnetic waves in media. The air-filled cavity model to show a typical diffraction pattern was applied to diffraction tomography imaging, and the result shows accurate location and area of cavity. But the calculated object function is not well matched the real object function, because the air-filled cavity model is not satisfied week scattered inhomogeneity for 1st born approximation, and the error term is included in estimating source wavelet from received signals. In spite of the object function error, the diffraction tomography assist for interpretation of subsurface as if conducted with travel time tomography. And the fracture model was tested, 1st born diffraction tomographic image is poor because of limited view angle coverage and violation of week scatter assumption, but the filtered image resolve the fracture somewhat better. The tested diffraction tomography image confirms effectiveness of filter for enhancing resolution. (author). 14

Time-resolved measurements with streaked diffraction patterns from electrons generated in laser plasma wakefield

Science.gov (United States)

He, Zhaohan; Nees, John; Hou, Bixue; Krushelnick, Karl; Thomas, Alec; Beaurepaire, Benoît; Malka, Victor; Faure, Jérôme

2013-10-01

Femtosecond bunches of electrons with relativistic to ultra-relativistic energies can be robustly produced in laser plasma wakefield accelerators (LWFA). Scaling the electron energy down to sub-relativistic and MeV level using a millijoule laser system will make such electron source a promising candidate for ultrafast electron diffraction (UED) applications due to the intrinsic short bunch duration and perfect synchronization with the optical pump. Recent results of electron diffraction from a single crystal gold foil, using LWFA electrons driven by 8-mJ, 35-fs laser pulses at 500 Hz, will be presented. The accelerated electrons were collimated with a solenoid magnetic lens. By applying a small-angle tilt to the magnetic lens, the diffraction pattern can be streaked such that the temporal evolution is separated spatially on the detector screen after propagation. The observable time window and achievable temporal resolution are studied in pump-probe measurements of photo-induced heating on the gold foil.

Femtosecond X-ray diffraction from two-dimensional protein crystals

Directory of Open Access Journals (Sweden)

Matthias Frank

2014-03-01

Full Text Available X-ray diffraction patterns from two-dimensional (2-D protein crystals obtained using femtosecond X-ray pulses from an X-ray free-electron laser (XFEL are presented. To date, it has not been possible to acquire transmission X-ray diffraction patterns from individual 2-D protein crystals due to radiation damage. However, the intense and ultrafast pulses generated by an XFEL permit a new method of collecting diffraction data before the sample is destroyed. Utilizing a diffract-before-destroy approach at the Linac Coherent Light Source, Bragg diffraction was acquired to better than 8.5 Å resolution for two different 2-D protein crystal samples each less than 10 nm thick and maintained at room temperature. These proof-of-principle results show promise for structural analysis of both soluble and membrane proteins arranged as 2-D crystals without requiring cryogenic conditions or the formation of three-dimensional crystals.

Undergraduate experiment with fractal diffraction gratings

International Nuclear Information System (INIS)

Monsoriu, Juan A; Furlan, Walter D; Pons, Amparo; Barreiro, Juan C; Gimenez, Marcos H

2011-01-01

We present a simple diffraction experiment with fractal gratings based on the triadic Cantor set. Diffraction by fractals is proposed as a motivating strategy for students of optics in the potential applications of optical processing. Fraunhofer diffraction patterns are obtained using standard equipment present in most undergraduate physics laboratories and compared with those obtained with conventional periodic gratings. It is shown that fractal gratings produce self-similar diffraction patterns which can be evaluated analytically. Good agreement is obtained between experimental and numerical results.

The X-ray powder diffraction pattern and lattice parameters of perovskite

International Nuclear Information System (INIS)

Ball, C.J.; Napier, J.G.

1988-02-01

The interplanar spacings and intensities of all lines appearing in the X-ray powder diffraction pattern of perovskite have been calculated. Many of the lines occur in groups with a large amount of overlap. As an aid to identifying the lines which are observed, the intensity profiles of the major groups have been plotted. Those lines which are relatively free of overlap and can be identified unambiguously have been used to calculate the lattice parameters, with the results a=5.4424 ± 0.0001 A, b=7.6417 ± 0.0002 A, c=5.3807 ± 0.0001 A

X-ray diffraction patterns of single crystals implanted with high-energy light ions

International Nuclear Information System (INIS)

Wieteska, K.

1998-01-01

X-ray diffraction patterns of silicon and gallium arsenide single crystals implanted with high-energy protons and α-particles were studied. A various models of lattice parameter changes were analysed. The agreement between the simulation and experiment proves that the lattice parameter depth-distribution can be assumed to be proportional to vacancy distribution obtained by Monte-Carlo method and from the Biersack-Ziegler theory. Most of the X-ray experiments were performed using synchrotron source of X-ray radiation in particular in the case of back-reflection and transmission section topographic methods. The new method of direct determination of the implanted ion ranges was proposed using synchrotron radiation back-reflection section topography. A number of new interference phenomena was revealed and explained. These interferences are important in the applications of diffraction theory in studying of the real structure of implanted layers. (author)

Study of caprine bones after moist and dry heat processes by X-ray diffraction

International Nuclear Information System (INIS)

Barbosa, Caroline M.; Azeredo, Soraia R.; Lopes, Ricardo T.; Souza, Sheila M.F.M de

2013-01-01

Bone tissue is a biological material composed of hydroxyapatite (HAp) and collagen matrix. The bone X-ray diffraction (XRD) pattern presents characteristics of the hydroxyapatite crystallography planes. This paper presents the characterization by X-ray diffraction of caprine bone powder pattern and the comparison of this pattern with moist or dry heat cooked bone patterns. The parameters chosen to characterize the X-ray diffraction peaks were: angular position (2θ), full width at half maximumt (FWHM), and relative intensity (I rel ). The X-ray diffraction patterns were obtained with a Shimadzu XRD-6000 diffractometer. The caprine bone XRD pattern revealed a significant correlation of several crystallographic parameters (lattice data) with hydroxyapatite. The profiles of the three bone types analyzed presented differences. The study showed as small angular displacement (decrease of the 2θ angle) of some peaks was observed after moist and dry heat cooking processes. The characterization of bone tissue aimed to contribute to future analysis in the field of archeology. (author)

Study of caprine bones after moist and dry heat processes by X-ray diffraction

Energy Technology Data Exchange (ETDEWEB)

Barbosa, Caroline M., E-mail: carolmattosb@yahoo.com.br [Instituto de Arqueologia Brasileira (IAB), Belford Roxo, RJ (Brazil); Azeredo, Soraia R.; Lopes, Ricardo T., E-mail: soraia@lin.ufrj.br [Coordenacao dos Programas de Pos-Graduacao em Engenharia (COPPE/LIN/UFRJ), Rio de Janeiro, RJ (Brazil). Laboratorio de Instrumentacao Nuclear; Souza, Sheila M.F.M de, E-mail: sferraz@ensp.fiocruz.br [Fundacao Oswaldo Cruz (ENSP/FIOCRUZ), Rio de Janeiro, RJ (Brazil). Escola Nacional de Saude Publica Sergio Arouca

2013-07-01

Bone tissue is a biological material composed of hydroxyapatite (HAp) and collagen matrix. The bone X-ray diffraction (XRD) pattern presents characteristics of the hydroxyapatite crystallography planes. This paper presents the characterization by X-ray diffraction of caprine bone powder pattern and the comparison of this pattern with moist or dry heat cooked bone patterns. The parameters chosen to characterize the X-ray diffraction peaks were: angular position (2θ), full width at half maximumt (FWHM), and relative intensity (I{sub rel}). The X-ray diffraction patterns were obtained with a Shimadzu XRD-6000 diffractometer. The caprine bone XRD pattern revealed a significant correlation of several crystallographic parameters (lattice data) with hydroxyapatite. The profiles of the three bone types analyzed presented differences. The study showed as small angular displacement (decrease of the 2θ angle) of some peaks was observed after moist and dry heat cooking processes. The characterization of bone tissue aimed to contribute to future analysis in the field of archeology. (author)

XaNSoNS: GPU-accelerated simulator of diffraction patterns of nanoparticles

Directory of Open Access Journals (Sweden)

V.S. Neverov

2017-01-01

Full Text Available XaNSoNS is an open source software with GPU support, which simulates X-ray and neutron 1D (or 2D diffraction patterns and pair-distribution functions (PDF for amorphous or crystalline nanoparticles (up to ∼107 atoms of heterogeneous structural content. Among the multiple parameters of the structure the user may specify atomic displacements, site occupancies, molecular displacements and molecular rotations. The software uses general equations nonspecific to crystalline structures to calculate the scattering intensity. It supports four major standards of parallel computing: MPI, OpenMP, Nvidia CUDA and OpenCL, enabling it to run on various architectures, from CPU-based HPCs to consumer-level GPUs.

XaNSoNS: GPU-accelerated simulator of diffraction patterns of nanoparticles

Science.gov (United States)

Neverov, V. S.

XaNSoNS is an open source software with GPU support, which simulates X-ray and neutron 1D (or 2D) diffraction patterns and pair-distribution functions (PDF) for amorphous or crystalline nanoparticles (up to ∼107 atoms) of heterogeneous structural content. Among the multiple parameters of the structure the user may specify atomic displacements, site occupancies, molecular displacements and molecular rotations. The software uses general equations nonspecific to crystalline structures to calculate the scattering intensity. It supports four major standards of parallel computing: MPI, OpenMP, Nvidia CUDA and OpenCL, enabling it to run on various architectures, from CPU-based HPCs to consumer-level GPUs.

Signature of dislocations and stacking faults of face-centred cubic nanocrystals in coherent X-ray diffraction patterns: a numerical study.

Science.gov (United States)

Dupraz, Maxime; Beutier, Guillaume; Rodney, David; Mordehai, Dan; Verdier, Marc

2015-06-01

Crystal defects induce strong distortions in diffraction patterns. A single defect alone can yield strong and fine features that are observed in high-resolution diffraction experiments such as coherent X-ray diffraction. The case of face-centred cubic nanocrystals is studied numerically and the signatures of typical defects close to Bragg positions are identified. Crystals of a few tens of nanometres are modelled with realistic atomic potentials and 'relaxed' after introduction of well defined defects such as pure screw or edge dislocations, or Frank or prismatic loops. Diffraction patterns calculated in the kinematic approximation reveal various signatures of the defects depending on the Miller indices. They are strongly modified by the dissociation of the dislocations. Selection rules on the Miller indices are provided, to observe the maximum effect of given crystal defects in the initial and relaxed configurations. The effect of several physical and geometrical parameters such as stacking fault energy, crystal shape and defect position are discussed. The method is illustrated on a complex structure resulting from the simulated nanoindentation of a gold nanocrystal.

Appearance of maxima of combined type in Moessbauer diffraction

International Nuclear Information System (INIS)

Kolpakov, A.V.; Ovchinnikova, E.N.; Kuz'min, R.N.

1978-01-01

An appearance of Bragg maxima in the Moessbauer diffraction pattern due to a combined hyperfine interaction on nuclei in a crystal is discussed. By a combined interaction one means presence on the nuclei of a magnetic field and tensor of electric field gradient. The structure RFe 2 R=Pu, Np, V, Zr, Tm) is considered. It has been shown that when a scattering system is in fields of several actions with various symmetries, the diffraction pattern is not an additive superposition of diffraction patterns of magnetic and electric quadrupole scatterings. In this case the diffraction patterns of magnetic and electric quadrupole scatterings. In this case the diffraction spectra have maxima forbidden by the extinction laws in diffraction in the presence of only a magnetic field or only electric quadrupole interaction

Powder diffraction from a continuous microjet of submicrometer protein crystals.

Science.gov (United States)

Shapiro, D A; Chapman, H N; Deponte, D; Doak, R B; Fromme, P; Hembree, G; Hunter, M; Marchesini, S; Schmidt, K; Spence, J; Starodub, D; Weierstall, U

2008-11-01

Atomic-resolution structures from small proteins have recently been determined from high-quality powder diffraction patterns using a combination of stereochemical restraints and Rietveld refinement [Von Dreele (2007), J. Appl. Cryst. 40, 133-143; Margiolaki et al. (2007), J. Am. Chem. Soc. 129, 11865-11871]. While powder diffraction data have been obtained from batch samples of small crystal-suspensions, which are exposed to X-rays for long periods of time and undergo significant radiation damage, the proof-of-concept that protein powder diffraction data from nanocrystals of a membrane protein can be obtained using a continuous microjet is shown. This flow-focusing aerojet has been developed to deliver a solution of hydrated protein nanocrystals to an X-ray beam for diffraction analysis. This method requires neither the crushing of larger polycrystalline samples nor any techniques to avoid radiation damage such as cryocooling. Apparatus to record protein powder diffraction in this manner has been commissioned, and in this paper the first powder diffraction patterns from a membrane protein, photosystem I, with crystallite sizes of less than 500 nm are presented. These preliminary patterns show the lowest-order reflections, which agree quantitatively with theoretical calculations of the powder profile. The results also serve to test our aerojet injector system, with future application to femtosecond diffraction in free-electron X-ray laser schemes, and for serial crystallography using a single-file beam of aligned hydrated molecules.

A method of combining STEM image with parallel beam diffraction and electron-optical conditions for diffractive imaging

International Nuclear Information System (INIS)

He Haifeng; Nelson, Chris

2007-01-01

We describe a method of combining STEM imaging functionalities with nanoarea parallel beam electron diffraction on a modern TEM. This facilitates the search for individual particles whose diffraction patterns are needed for diffractive imaging or structural studies of nanoparticles. This also lays out a base for 3D diffraction data collection

X-ray diffraction pattern and relative crystallinity of irradiated arrowroot starch

Energy Technology Data Exchange (ETDEWEB)

Barroso, Aline G.; Garcia, Rafael H.L.; Del Mastro, Nelida L., E-mail: nlmastro@ipen.br [Instituto de Pesquisas Energeticas e Nucleares (IPEN/CNEN-SP), Sao Paulo, SP (Brazil)

2017-11-01

After cereals, tubers and roots are the major source of starch for food and industrial uses. Arrowroot refers to any plant of the genus Marantha, but the term is most commonly used to describe the easily digested starch obtained from the rhizomes of Marantha arundinacae. The rhizomes of this herbaceous plant contain about 20% of starch. As few studies exist on arrowroot starch, the objective of this preliminary work was to study the X-ray diffraction patterns (XRD) patterns of arrowroot starch when treated by γ-radiation with doses up to 15 kGy in a {sup 60}Co source. The XRD patterns of the arrowroot starch exhibited A-type crystalline arrangements with strong peaks at approximately 15º, 17º, 18º and 23º (2θ). A slight increase of diffractogram peaks intensity was noticed after the irradiation process. The crystallinity index was calculated using Bruker DIFFRAC.EVA version 4.2 software. Relative crystallinity seems to increase with radiation doses, and this effect is more noticeable at low doses. That can be attributed to different radiation sensitivity among the amorphous and crystalline regions of the arrowroot starch molecule. Present results will contribute to elucidate the behavior under radiation treatment of this starchy component increasingly employed by the food industry. (author)

X-ray diffraction pattern and relative crystallinity of irradiated arrowroot starch

International Nuclear Information System (INIS)

Barroso, Aline G.; Garcia, Rafael H.L.; Del Mastro, Nelida L.

2017-01-01

After cereals, tubers and roots are the major source of starch for food and industrial uses. Arrowroot refers to any plant of the genus Marantha, but the term is most commonly used to describe the easily digested starch obtained from the rhizomes of Marantha arundinacae. The rhizomes of this herbaceous plant contain about 20% of starch. As few studies exist on arrowroot starch, the objective of this preliminary work was to study the X-ray diffraction patterns (XRD) patterns of arrowroot starch when treated by γ-radiation with doses up to 15 kGy in a "6"0Co source. The XRD patterns of the arrowroot starch exhibited A-type crystalline arrangements with strong peaks at approximately 15º, 17º, 18º and 23º (2θ). A slight increase of diffractogram peaks intensity was noticed after the irradiation process. The crystallinity index was calculated using Bruker DIFFRAC.EVA version 4.2 software. Relative crystallinity seems to increase with radiation doses, and this effect is more noticeable at low doses. That can be attributed to different radiation sensitivity among the amorphous and crystalline regions of the arrowroot starch molecule. Present results will contribute to elucidate the behavior under radiation treatment of this starchy component increasingly employed by the food industry. (author)

Diffractive DIS: Where are we?

International Nuclear Information System (INIS)

Nikolaev, N.N.

2001-01-01

A brief review of the modern QCD theory of diffractive DIS is given. The recent progress has been remarkably rapid, all the principal predictions from the color dipole approach to diffraction - the (Q 2 + m V 2 ) scaling, the pattern of SCHNC, shrinkage of the diffraction cone in hard diffractive DIS, the strong impact of longitudinal gluons in inclusive J/Ψ production at Tevatron - have been confirmed experimentally

INVESTIGATIONS THE EFFECT OF EOSIN B DYE ON X- RAY DIFFRACTION PATTERN OF SILVER NITRATE DOPED PVP FILMS

Directory of Open Access Journals (Sweden)

Mahasin F. Hadi Al-Kadhemy

2017-07-01

Full Text Available In this research, X-ray diffraction of the powder (PVP polymer, Eosin B dye, and silver nitrate and (EB/PVP, AgNO3/PVP, EB/AgNO3/PVP films have been studied. Casting method is used to prepare homogeneous films on plastic petri dishes. All parameters accounted for the X-ray diffraction; full width half maximum (FWHM, Miller indices (hkl, size of crystalline (D, Specific Surface Area (S and Dislocation Density (δ.The nature of the structural of materials and films will be investigated. The XRD pattern of PVP polymer was amorphous structure with two broader peaks and the Eosin B dye and silver nitrate have crystalline structure. While the mixture between these materials led to appearing some crystalline peaks into XRD pattern of PVP polymer.

Reconstruction of Laser-Induced Surface Topography from Electron Backscatter Diffraction Patterns.

Science.gov (United States)

Callahan, Patrick G; Echlin, McLean P; Pollock, Tresa M; De Graef, Marc

2017-08-01

We demonstrate that the surface topography of a sample can be reconstructed from electron backscatter diffraction (EBSD) patterns collected with a commercial EBSD system. This technique combines the location of the maximum background intensity with a correction from Monte Carlo simulations to determine the local surface normals at each point in an EBSD scan. A surface height map is then reconstructed from the local surface normals. In this study, a Ni sample was machined with a femtosecond laser, which causes the formation of a laser-induced periodic surface structure (LIPSS). The topography of the LIPSS was analyzed using atomic force microscopy (AFM) and reconstructions from EBSD patterns collected at 5 and 20 kV. The LIPSS consisted of a combination of low frequency waviness due to curtaining and high frequency ridges. The morphology of the reconstructed low frequency waviness and high frequency ridges matched the AFM data. The reconstruction technique does not require any modification to existing EBSD systems and so can be particularly useful for measuring topography and its evolution during in situ experiments.

Classifying and assembling two-dimensional X-ray laser diffraction patterns of a single particle to reconstruct the three-dimensional diffraction intensity function: resolution limit due to the quantum noise.

Science.gov (United States)

Tokuhisa, Atsushi; Taka, Junichiro; Kono, Hidetoshi; Go, Nobuhiro

2012-05-01

A new two-step algorithm is developed for reconstructing the three-dimensional diffraction intensity of a globular biological macromolecule from many experimentally measured quantum-noise-limited two-dimensional X-ray laser diffraction patterns, each for an unknown orientation. The first step is classification of the two-dimensional patterns into groups according to the similarity of direction of the incident X-rays with respect to the molecule and an averaging within each group to reduce the noise. The second step is detection of common intersecting circles between the signal-enhanced two-dimensional patterns to identify their mutual location in the three-dimensional wavenumber space. The newly developed algorithm enables one to detect a signal for classification in noisy experimental photon-count data with as low as ~0.1 photons per effective pixel. The wavenumber of such a limiting pixel determines the attainable structural resolution. From this fact, the resolution limit due to the quantum noise attainable by this new method of analysis as well as two important experimental parameters, the number of two-dimensional patterns to be measured (the load for the detector) and the number of pairs of two-dimensional patterns to be analysed (the load for the computer), are derived as a function of the incident X-ray intensity and quantities characterizing the target molecule. © 2012 International Union of Crystallography

Effects of focused ion beam milling on electron backscatter diffraction patterns in strontium titanate and stabilized zirconia

DEFF Research Database (Denmark)

Saowadee, Nath; Agersted, Karsten; Bowen, Jacob R.

2012-01-01

This study investigates the effect of focused ion beam (FIB) current and accelerating voltage on electron backscatter diffraction pattern quality of yttria‐stabilized zirconia (YSZ) and Nb‐doped strontium titanate (STN) to optimize data quality and acquisition time for 3D‐EBSD experiments by FIB...

Rietveld analysis, powder diffraction and cement

International Nuclear Information System (INIS)

Peterson, V.

2002-01-01

Full text: Phase quantification of cement is essential in its industrial use, however many methods are inaccurate and/or time consuming. Powder diffraction is one of the more accurate techniques used for quantitative phase analysis of cement. There has been an increase in the use of Rietveld refinement and powder diffraction for the analysis and phase quantification of cement and its components in recent years. The complex nature of cement components, existence of solid solutions, polymorphic variation of phases and overlapping phase peaks in diffraction patterns makes phase quantification of cements by powder diffraction difficult. The main phase in cement is alite, a solid solution of tricalcium silicate. Tricalcium silicate has been found to exist in seven modifications in three crystal systems, including triclinic, monoclinic, and rhombohedral structures. Hence, phase quantification of cements using Rietveld methods usually involves the simultaneous modelling of several tricalcium silicate structures to fit the complex alite phase. An industry ordinary Portland cement, industry and standard clinker, and a synthetic tricalcium silicate were characterised using neutron, laboratory x-ray and synchrotron powder diffraction. Diffraction patterns were analysed using full-profile Rietveld refinement. This enabled comparison of x-ray, neutron and synchrotron data for phase quantification of the cement and examination of the tricalcium silicate. Excellent Rietveld fits were achieved, however the results showed that the quantitative phase analysis results differed for some phases in the same clinker sample between various data sources. This presentation will give a short introduction about cement components including polymorphism, followed by the presentation of some problems in phase quantification of cements and the role of Rietveld refinement in solving these problems. Copyright (2002) Australian X-ray Analytical Association Inc

Semiclassical perturbation theory for diffraction in heavy atom surface scattering.

Science.gov (United States)

Miret-Artés, Salvador; Daon, Shauli; Pollak, Eli

2012-05-28

The semiclassical perturbation theory formalism of Hubbard and Miller [J. Chem. Phys. 78, 1801 (1983)] for atom surface scattering is used to explore the possibility of observation of heavy atom diffractive scattering. In the limit of vanishing ℏ the semiclassical theory is shown to reduce to the classical perturbation theory. The quantum diffraction pattern is sensitive to the characteristics of the beam of incoming particles. Necessary conditions for observation of quantum diffraction are derived for the angular width of the incoming beam. An analytic expression for the angular distribution as a function of the angular and momentum variance of the incoming beam is obtained. We show both analytically and through some numerical results that increasing the angular width of the incident beam leads to decoherence of the quantum diffraction peaks and one approaches the classical limit. However, the incoherence of the beam in the parallel direction does not destroy the diffraction pattern. We consider the specific example of Ar atoms scattered from a rigid LiF(100) surface.

A FORTRAN program for an IBM PC compatible computer for calculating kinematical electron diffraction patterns

International Nuclear Information System (INIS)

Skjerpe, P.

1989-01-01

This report describes a computer program which is useful in transmission electron microscopy. The program is written in FORTRAN and calculates kinematical electron diffraction patterns in any zone axis from a given crystal structure. Quite large unit cells, containing up to 2250 atoms, can be handled by the program. The program runs on both the Helcules graphic card and the standard IBM CGA card

High temperature neutron diffraction study of LaPO4

International Nuclear Information System (INIS)

Mishra, S.K.; Mittal, R.; Ningthoujam, R.S.; Vatsa, R.K.; Hansen, T.

2016-01-01

We report high temperature powder neutron diffractions study in LaPO 4 using high-flux D20 neutron diffractometer in the Institut Laue-Langevin, France. The measurements were carried out in high resolution mode (incident neutron wavelength 1.36 A) at various temperature upto 900°C. CarefuI inspection of temperature dependence of diffraction data showed appearance and disappearance of certain Bragg's reflections above 1273 K. It is a signature of structural phase transition. Rietveld refinement of the powder diffraction data revealed that diffraction patterns at and above 800°C could be indexed using the monoclinic structure with P21/n space group. Detail analysis for identify the water molecules is under investigation. (author)

Mineralogical applications of electron diffraction. 1. Theory and techniques

Science.gov (United States)

Ross, Malcolm; Christ, C.L.

1958-01-01

The small wavelengths used in electron-diffraction experiments and the thinness of the crystals necessary for the transmission of the electron beam combine to require a somewhat different diffraction geometry for the interpretation of electron-diffraction patterns than is used in the interpretation of X-ray diffraction patterns. This geometry, based on the reciprocal lattice concept and geometrical construction of Ewald, needed for the interpretation.

Undergraduate Experiment with Fractal Diffraction Gratings

Science.gov (United States)

Monsoriu, Juan A.; Furlan, Walter D.; Pons, Amparo; Barreiro, Juan C.; Gimenez, Marcos H.

2011-01-01

We present a simple diffraction experiment with fractal gratings based on the triadic Cantor set. Diffraction by fractals is proposed as a motivating strategy for students of optics in the potential applications of optical processing. Fraunhofer diffraction patterns are obtained using standard equipment present in most undergraduate physics…

Diffraction-Enhanced Imaging for studying pattern recognition in cranial ontogeny of bats and marsupials

International Nuclear Information System (INIS)

Rocha, H.S.; Lopes, R.T.; Pessoa, L.M.; Hoennicke, M.G.; Tirao, G.; Cusatis, C.; Mazzaro, I.; Giles, C.

2005-01-01

The key to understanding evolution lies in the elucidation of mechanisms responsible for the observed underlying patterns and in the observation of sequences that emerge from those evolutionary landmarks. The comparative development can be used to access the derivation of form and the homology versus the convergence of evolution features. Phylogenetic and biological homologies are necessary to discern the evolutionary origins of these features. This work examined the patterns of cranial formation in pre-born bat specimens as well as post-born opossum by means of microradiography and Diffraction-Enhanced Radiography (DER) techniques. A direct conversion CCD camera was used to provide micrometer spatial resolution in order to acquire highly detailed density images. This technique allows the observation of structures, in early stages of development, which were impossible to be observed with traditional techniques, such as clearing and staining. Some cranial features have been described for adults in the literature, but the detailed description of the appearance sequence of those features in these species is still unknown and obscure. Microradiography and diffraction-enhanced imaging can improve quality of morphological detail analysis and permit the identification of anatomical landmarks that are useful in comparative studies and are still unknown in both species. In this study, we access evolution features in cranial morphology of bats and marsupials using both X-ray techniques

Diffraction-Enhanced Imaging for studying pattern recognition in cranial ontogeny of bats and marsupials

Energy Technology Data Exchange (ETDEWEB)

Rocha, H.S. [Laboratorio de Instrumentacao Nuclear (LIN), COPPE, UFRJ (Brazil); Lopes, R.T. [Laboratorio de Instrumentacao Nuclear (LIN), COPPE, UFRJ (Brazil)]. E-mail: ricardo@lin.ufrj.br; Pessoa, L.M. [Laboratorio de Mastozoologia, Departamento Zoologia, Instituto de Biologia, UFRJ (Brazil); Hoennicke, M.G. [Laboratorio de Optica de Raios X e Instrumentacao (LORXI) , Departamento de Fisica, UFPR (Brazil); Tirao, G. [Laboratorio de Optica de Raios X e Instrumentacao (LORXI) , Departamento de Fisica, UFPR (Brazil); Faculdad de Mat. Astronomia y Fisica (FAMAF), UNC. Cordoba (Argentina); Cusatis, C. [Laboratorio de Optica de Raios X e Instrumentacao (LORXI) , Departamento de Fisica, UFPR (Brazil); Mazzaro, I. [Laboratorio de Optica de Raios X e Instrumentacao (LORXI) , Departamento de Fisica, UFPR (Brazil); Giles, C. [Laboratorio Nacional de Luz Sincrotron (LNLS)/Laboratorio de Cristalografia Aplicada e Raios X, Instituto de Fisica Gleb Wataghin, UNICAMP (Brazil)

2005-08-11

The key to understanding evolution lies in the elucidation of mechanisms responsible for the observed underlying patterns and in the observation of sequences that emerge from those evolutionary landmarks. The comparative development can be used to access the derivation of form and the homology versus the convergence of evolution features. Phylogenetic and biological homologies are necessary to discern the evolutionary origins of these features. This work examined the patterns of cranial formation in pre-born bat specimens as well as post-born opossum by means of microradiography and Diffraction-Enhanced Radiography (DER) techniques. A direct conversion CCD camera was used to provide micrometer spatial resolution in order to acquire highly detailed density images. This technique allows the observation of structures, in early stages of development, which were impossible to be observed with traditional techniques, such as clearing and staining. Some cranial features have been described for adults in the literature, but the detailed description of the appearance sequence of those features in these species is still unknown and obscure. Microradiography and diffraction-enhanced imaging can improve quality of morphological detail analysis and permit the identification of anatomical landmarks that are useful in comparative studies and are still unknown in both species. In this study, we access evolution features in cranial morphology of bats and marsupials using both X-ray techniques.

Crystallite Size and Microstrain Measurement of Cathode Material after Mechanical Milling using Neutron Diffraction Technique

Directory of Open Access Journals (Sweden)

A. Fajar

2010-12-01

Full Text Available The measurements of neutron diffraction patterns of commercially product and 10 hour mechanically milled cathode material lithium cobaltites (LiCoO2 have been performed. Rietveld analysis using FullProf does not show the change of crystal structure due to milling process, but the diffraction pattern has a lower intensity and the diffraction-line was broadening. The results of line-broadening study on milled sample using Rietveld methods detected that the microstrain was occurred in the sample with value 0.127080(35 % and the average crystallite size was 424.78(20 Å.

X-ray diffraction imaging of material microstructures

KAUST Repository

Varga, Laszlo

2016-10-20

Various examples are provided for x-ray imaging of the microstructure of materials. In one example, a system for non-destructive material testing includes an x-ray source configured to generate a beam spot on a test item; a grid detector configured to receive x- rays diffracted from the test object; and a computing device configured to determine a microstructure image based at least in part upon a diffraction pattern of the x-rays diffracted from the test object. In another example, a method for determining a microstructure of a material includes illuminating a beam spot on the material with a beam of incident x-rays; detecting, with a grid detector, x-rays diffracted from the material; and determining, by a computing device, a microstructure image based at least in part upon a diffraction pattern of the x-rays diffracted from the material.

Emergence of Fresnel diffraction zones in gravitational lensing by a cosmic string

Energy Technology Data Exchange (ETDEWEB)

Fernández-Núñez, Isabel [Departament de Física Quàntica i Astrofísica, Facultat de Física, Universitat de Barcelona, Martí i Franquès 1, E-08028 Barcelona (Spain); Institut de Ciències del Cosmos (ICCUB), Facultat de Física, Universitat de Barcelona, Martí i Franquès 1, E-08028 Barcelona (Spain); Bulashenko, Oleg, E-mail: oleg.bulashenko@ub.edu [Departament de Física Quàntica i Astrofísica, Facultat de Física, Universitat de Barcelona, Martí i Franquès 1, E-08028 Barcelona (Spain)

2017-06-09

The possibility to detect cosmic strings – topological defects of early Universe, by means of wave effects in gravitational lensing is discussed. To find the optimal observation conditions, we define the hyperbolic-shaped Fresnel observation zones associated with the diffraction maxima and analyse the frequency patterns of wave amplification corresponding to different alignments. In particular, we show that diffraction of gravitational waves by the string may lead to significant amplification at cosmological distances. The wave properties we found are quite different from what one would expect, for instance, from light scattered off a thin wire or slit, since a cosmic string, as a topological defect, gives no shadow at all. - Highlights: • Interference and diffraction of gravitational waves by a cosmic string are studied. • Uniform asymptotic theory of diffraction is applied for a finite distance source. • Hyperbolic-shaped Fresnel observation zones associated with maxima of diffraction. • Frequency patterns modulated by diffraction for different string alignments are given. • The method is applicable to condensed-matter defects and other types of waves.

Structure of 3 at.% and 9 at.% Si-doped HfO{sub 2} from combined refinement of X-ray and neutron diffraction patterns

Energy Technology Data Exchange (ETDEWEB)

Zhao, Lili [Department of Materials Science and Engineering, North Carolina State University, NC 27695 (United States); School of Information Science and Technology, Northwest University, Xi' an 710127 (China); Hou, Dong; Usher, Tedi-Marie; Iamsasri, Thanakorn; Fancher, Chris M.; Forrester, Jennifer S. [Department of Materials Science and Engineering, North Carolina State University, NC 27695 (United States); Nishida, Toshikazu [Department of Electrical and Computer Engineering, University of Florida, FL 32611 (United States); Moghaddam, Saeed [Department of Mechanical and Aerospace Engineering, University of Florida, FL 32611 (United States); Jones, Jacob L., E-mail: jacobjones@ncsu.edu [Department of Materials Science and Engineering, North Carolina State University, NC 27695 (United States)

2015-10-15

The crystal structure of 3 at.% and 9 at.% Si-doped HfO{sub 2} powder was determined through refinements using X-ray and neutron diffraction patterns. The lattice parameters, atomic positions, dopant occupancy, and the second phase fraction were determined with high precision using a combined full pattern fitting via the Rietveld method. The results show that both 3 at.% and 9 at.% Si-doped HfO{sub 2} powder exhibit the monoclinic crystal structure with P 1 2{sub 1}/c 1 space group. Through the combined refinement, the crystal structure parameters, especially for the positions and occupancies of the lighter atoms, were more precisely determined compared to independent X-ray diffraction refinement. Although the ionic radius of Si{sup 4+} is smaller than Hf{sup 4+}, with increasing Si occupancy, the unit cell volume slightly increases; possible mechanisms for this effect are discussed. Moreover, the refined results provide evidence of the existence of a non-equilibrium phase of Hf{sub x}Si{sub 1−x}O{sub 2}. The second phase (SiO{sub 2}) fraction is determined as 0.17 at.% for 3 at.% Si-doped HfO{sub 2} powders and 1.7 at.% for 9 at.% Si-doped HfO{sub 2} powders. - Highlights: • X-ray and neutron diffraction patterns were used to determine crystal structure. • Results from independent refinements and a combined refinement were compared. • Highly precise structural parameters were obtained by the combined refinement. • Structural data of 3 at.% and 9 at.% Si-doped HfO{sub 2} are provided. • The unit cell volume slightly increases with Si concentration from 3 to 9 at.%.

Towards automated diffraction tomography: Part I-Data acquisition

International Nuclear Information System (INIS)

Kolb, U.; Gorelik, T.; Kuebel, C.; Otten, M.T.; Hubert, D.

2007-01-01

The ultimate aim of electron diffraction data collection for structure analysis is to sample the reciprocal space as accurately as possible to obtain a high-quality data set for crystal structure determination. Besides a more precise lattice parameter determination, fine sampling is expected to deliver superior data on reflection intensities, which is crucial for subsequent structure analysis. Traditionally, three-dimensional (3D) diffraction data are collected by manually tilting a crystal around a selected crystallographic axis and recording a set of diffraction patterns (a tilt series) at various crystallographic zones. In a second step, diffraction data from these zones are combined into a 3D data set and analyzed to yield the desired structure information. Data collection can also be performed automatically, with the recent advances in tomography acquisition providing a suitable basis. An experimental software module has been developed for the Tecnai microscope for such an automated diffraction pattern collection while tilting around the goniometer axis. The module combines STEM imaging with diffraction pattern acquisition in nanodiffraction mode. It allows automated recording of diffraction tilt series from nanoparticles with a size down to 5 nm

X-ray diffraction 2 - diffraction principles

International Nuclear Information System (INIS)

O'Connor, B.

1999-01-01

Full text: The computation of powder diffraction intensities is based on the principle that the powder pattern comprises the summation of the intensity contributions from each of the crystallites (or single crystals) in the material. Therefore, it is of value for powder diffractionists to appreciate the form of the expression for calculating single crystal diffraction pattern intensities. This knowledge is especially important for Rietveld analysis practitioners in terms of the (i) mathematics of the method and (ii) retrieving single crystal structure data from the literature. We consider the integrated intensity from a small single crystal being rotated at velocity ω through the Bragg angle θ for reflection (hkl).... I(hkl) = [l o /ω]. [e 4 /m 2 c 4 ]. [λ 3 δV F(hkl) 2 /υ 2 ].[(1+cos 2 2θ)/2sin2θ] where e, m and c are the usual fundamental constants; λ is the x-ray wavelength, δV is the crystallite volume; F(hkl) is the structure factor; υ is the unit cell volume; and (1+cos 2 θ)/2sin2θ] is the Lorentz-polarisation factor for an unpolarised incident beam. The expression does not include a contribution for extinction. The influence of factors λ, δV, F(hkl) and υ on the intensities should be appreciated by powder diffractionists, especially the structure factor, F(hkl), which is responsible for the fingerprint nature of diffraction patterns, such as the rise and fall of intensity from peak to peak. The structure factor expression represents the summation of the scattered waves from each of the j scattering centres (i e atoms) in the unit cell: F(hkl) Σ f j exp[2πi (h.x j +k.y i +l. z i )] T j . Symbol f is the scattering factor (representing the atom-type scattering efficiency); (x, y, z) are the fractional position coordinates of atom j within the unit cell; and T is the thermal vibration factor for the atom given by: T j = 8π 2 2 > sin 2 θ/λ 2 with 2 > being the mean-square vibration amplitude of the atom (assumed to be isotropic). The

X-ray diffraction patterns of thermally-reduced graphenes

International Nuclear Information System (INIS)

Ju, Hae-Mi; Choi, Sung-Ho; Huh, Seung-Hun

2010-01-01

Thermally-reduced graphenes (GPs) from graphene oxides (GOs) in the range of 200 - 800 .deg. C have been investigated by using X-ray diffraction (XRD). The temperature-dependent evolutions of the (002) peaks show that exfoliation of GO sheets occurs, along with wrinkling, at ∼200 .deg. C and that high-quality GPs are produced at ∼ 600 .deg. C (GP 600 ). These phenomena are explained by the vaporization of intercalated water molecules and the effective removal of the oxide groups of GO by thermal annealing, respectively. GP 600 exhibited a clean and sharp (002) peak corresponding to an interlayer distance of 3.392 A, which is close to that of conventional graphene (∼3.4 A). The structure of GP 600 is further discussed.

The dynamics of diffracted rays in foams

Energy Technology Data Exchange (ETDEWEB)

Tufaile, A., E-mail: tufaile@usp.br; Tufaile, A.P.B.

2015-12-18

We have studied some aspects of the optics of the light scattering in foams. This paper describes the difference between rays and diffracted rays from the point of view of geometrical theory of diffraction. We have represented some bifurcations of light rays using dynamical systems. Based on our observations of foams, we created a solid optical device. The interference patterns of light scattering in foams forming Airy fringes were explored observing the pattern named as the eye of Horus. In the cases we examine, these Airy fringes are associated with light scattering in curved surfaces, while the halo formation is related to the law of edge diffraction. We are proposing a Pohl interferometer using a three-sided bubble/Plateau border system. - Highlights: • We obtained halos scattering light in foams. • We model the light scattering in foams using the geometrical theory of diffraction. • We examine the difference between rays and the diffracted rays. • We developed optical devices for diffracted rays.

Computer programs for unit-cell determination in electron diffraction experiments

International Nuclear Information System (INIS)

Li, X.Z.

2005-01-01

A set of computer programs for unit-cell determination from an electron diffraction tilt series and pattern indexing has been developed on the basis of several well-established algorithms. In this approach, a reduced direct primitive cell is first determined from experimental data, in the means time, the measurement errors of the tilt angles are checked and minimized. The derived primitive cell is then checked for possible higher lattice symmetry and transformed into a proper conventional cell. Finally a least-squares refinement procedure is adopted to generate optimum lattice parameters on the basis of the lengths of basic reflections in each diffraction pattern and the indices of these reflections. Examples are given to show the usage of the programs

Characterization of monoclinic crystals in tablets by pattern-fitting procedure using X-ray powder diffraction data.

Science.gov (United States)

Yamamura, Shigeo; Momose, Yasunori

2003-06-18

The purpose of this study is to characterize the monoclinic crystals in tablets by using X-ray powder diffraction data and to evaluate the deformation feature of crystals during compression. The monoclinic crystals of acetaminophen and benzoic acid were used as the samples. The observed X-ray diffraction intensities were fitted to the analytic expression, and the fitting parameters, such as the lattice parameters, the peak-width parameters, the preferred orientation parameter and peak asymmetric parameter were optimized by a non-linear least-squares procedure. The Gauss and March distribution functions were used to correct the preferred orientation of crystallites in the tablet. The March function performed better in correcting the modification of diffraction intensity by preferred orientation of crystallites, suggesting that the crystallites in the tablets had fiber texture with axial orientation. Although a broadening of diffraction peaks was observed in acetaminophen tablets with an increase of compression pressure, little broadening was observed in the benzoic tablets. These results suggest that "acetaminophen is a material consolidating by fragmentation of crystalline particles and benzoic acid is a material consolidating by plastic deformation then occurred rearrangement of molecules during compression". A pattern-fitting procedure is the superior method for characterizing the crystalline drugs of monoclinic crystals in the tablets, as well as orthorhombic isoniazid and mannitol crystals reported in the previous paper.

Diffraction by DNA, carbon nanotubes and other helical nanostructures

International Nuclear Information System (INIS)

Lucas, Amand A; Lambin, Philippe

2005-01-01

This review discusses the diffraction patterns of x-rays or electrons scattered by fibres of helical biological molecules and by carbon nanotubes (CNTs) from the unified point of view of the Fourier-Bessel transform of an atomic helix. This paper is intended for scientists who are not professional crystallographers. X-ray fibre diffraction patterns of Pauling's protein α-helix and of Crick and Pauling's protein coiled-coil are revisited. This is followed by a non-technical comparison between the historic x-ray diffraction patterns of the A and B conformations of DNA, which were crucial for the discovery of the double helix. The qualitative analysis of the diffraction images is supported by novel optical simulation experiments designed to pinpoint the gross structural informational content of the patterns. The spectacular helical structure of the tobacco mosaic virus determined by Rosalind Franklin and co-workers will then be described as an early example of the great power of x-ray crystallography in determining the structure of a large biomolecular edifice. After these mostly historical and didactic case studies, this paper will consider electron diffraction and transmission electron microscopy of CNTs of great current interest, focusing particularly on recent data obtained for single-wall, double-wall and scrolled nanotubes. Several points of convergence between the interpretations of the diffraction patterns of biological helices and CNTs will be emphasized

Diffraction limit of refractive compound lens

International Nuclear Information System (INIS)

Kolchevsky, N.N.; Petrov, P.V.

2015-01-01

A compound X-ray and neutron lenses is an array of lenses with a common axis. The resolution limited by aberration and by diffraction. Diffraction limit comes from theory based on absorption aperture of the compound refractive lenses. Beam passing through transparent lenses form Airy pattern. Results of calculation of diffraction resolution limit for non-transparent X-ray and neutron lenses are discussed. (authors)

Small area analysis using micro-diffraction techniques

International Nuclear Information System (INIS)

Goehner, Raymond P.; Tissot, Ralph G. Jr.; Michael, Joseph R.

2000-01-01

An overall trend toward smaller electronic packages and devices makes it increasingly important and difficult to obtain meaningful diffraction information from small areas. X-ray micro-diffraction, electron back-scattered diffraction (EBSD) and Kossel are micro-diffraction techniques used for crystallographic analysis including texture, phase identification and strain measurements. X-ray micro-diffraction primarily is used for phase analysis and residual strain measurements. X-ray micro-diffraction primarily is used for phase analysis and residual strain measurements of areas between 10 microm to 100 microm. For areas this small glass capillary optics are used for producing a usable collimated x-ray beam. These optics are designed to reflect x-rays below the critical angle therefore allowing for larger solid acceptance angle at the x-ray source resulting in brighter smaller x-ray beams. The determination of residual strain using micro-diffraction techniques is very important to the semiconductor industry. Residual stresses have caused voiding of the interconnect metal which then destroys electrical continuity. Being able to determine the residual stress helps industry to predict failures from the aging effects of interconnects due to this stress voiding. Stress measurements would be impossible using a conventional x-ray diffractometer; however, utilizing a 30 microm glass capillary these small areas are readily assessable for analysis. Kossel produces a wide angle diffraction pattern from fluorescent x-rays generated in the sample by an e-beam in a SEM. This technique can yield very precise lattice parameters for determining strain. Fig. 2 shows a Kossel pattern from a Ni specimen. Phase analysis on small areas is also possible using an energy dispersive spectrometer (EBSD) and x-ray micro-diffraction techniques. EBSD has the advantage of allowing the user to observe the area of interest using the excellent imaging capabilities of the SEM. An EDS detector has been

Nonlinear diffraction from a virtual beam

DEFF Research Database (Denmark)

Saltiel, Solomon M.; Neshev, Dragomir N.; Krolikowski, Wieslaw

2010-01-01

We observe experimentally a novel type of nonlinear diffraction in the process of two-wave mixing on a nonlinear quadratic grating.We demonstrate that when the nonlinear grating is illuminated simultaneously by two noncollinear beams, a second-harmonic diffraction pattern is generated by a virtual...... beam propagating along the bisector of the two pump beams. The observed iffraction phenomena is a purely nonlinear effect that has no analogue in linear diffraction...

Angular criterion for distinguishing between Fraunhofer and Fresnel diffraction

International Nuclear Information System (INIS)

Medina, Francisco F.; Garcia-Sucerquia, Jorge; Castaneda, Roman; Matteucci, Giorgio

2003-03-01

The distinction between Fresnel and Fraunhofer diffraction is a crucial condition for the accurate analysis of diffracting structures. In this paper we propose a criterion based on the angle subtended by the first zero of the diffraction pattern from the center of the diffracting aperture. The determination of the zero of the diffraction pattern is the crucial point for assuring the precision of the criterion. It mainly depends on the dynamical range of the detector. Therefore, the applicability of adequate thresholds for different detector types is discussed. The criterion is also generalized by expressing it in terms of the number of Fresnel zones delimited by the aperture. Simulations are reported for illustrating the feasibility of the criterion. (author)

A fully automatic peak-search program for the evaluation of Gauss-shaped diffraction patterns

International Nuclear Information System (INIS)

Lauterjung, J.; Will, G.; Hinze, E.

1985-01-01

Diffraction patterns (X-rays or neutrons) often contain regions of overlapping, unresolved peaks. When using energy-dispersive techniques with solid state detectors the degree of overlap is especially high because of the poor resolution of such detectors. Profile analysis then offers the possibility to overcome, or at least reduce this drawback. In this paper a peak-search program is represented for fully automatic separation of the individual peaks. Only the instrumental parameter fwhm (full width at half-maximum) and the recorded spectrum are required as input for the program. Results are given for orthorhombic MnSO 4 . (orig.)

Diffraction enhanced kinetic depth X-ray imaging

Science.gov (United States)

Dicken, A.

An increasing number of fields would benefit from a single analytical probe that can characterise bulk objects that vary in morphology and/or material composition. These fields include security screening, medicine and material science. In this study the X-ray region is shown to be an effective probe for the characterisation of materials. The most prominent analytical techniques that utilise X-radiation are reviewed. The study then focuses on methods of amalgamating the three dimensional power of kinetic depth X-ray (KDFX) imaging with the materials discrimination of angular dispersive X-ray diffraction (ADXRD), thus providing KDEX with a much needed material specific counterpart. A knowledge of the sample position is essential for the correct interpretation of diffraction signatures. Two different sensor geometries (i.e. circumferential and linear) that are able to collect end interpret multiple unknown material diffraction patterns and attribute them to their respective loci within an inspection volume are investigated. The circumferential and linear detector geometries are hypothesised, simulated and then tested in an experimental setting with the later demonstrating a greater ability at discerning between mixed diffraction patterns produced by differing materials. Factors known to confound the linear diffraction method such as sample thickness and radiation energy have been explored and quantified with a possible means of mitigation being identified (i.e. via increasing the sample to detector distance). A series of diffraction patterns (following the linear diffraction approach) were obtained from a single phantom object that was simultaneously interrogated via KDEX imaging. Areas containing diffraction signatures matched from a threat library have been highlighted in the KDEX imagery via colour encoding and match index is inferred by intensity. This union is the first example of its kind and is called diffraction enhanced KDEX imagery. Finally an additional

X-ray diffraction studies of chitosan acetate-based polymer electrolytes

International Nuclear Information System (INIS)

Osman, Z.; Ibrahim, Z.A.; Abdul Kariem Arof

2002-01-01

Chitosan is the product when partially deacetylated chitin dissolves in dilute acetic acid. This paper presents the x-ray diffraction patterns of chitosan acetate, plasticised chitosan acetate and plasticised-salted chitosan acetate films. The results show that the chitosan acetate based polymer electrolyte films are not completely amorphous but it is partially crystalline. X-ray diffraction study also confirms the occurrence of the complexation between chitosan and the salt and the interaction between salt and plasticizer. The salt-chitosan interaction is clearly justified by infrared spectroscopy. (Author)

Stress evaluation in thin films: Micro-focus synchrotron X-ray diffraction combined with focused ion beam patterning for d{sub o} evaluation

Energy Technology Data Exchange (ETDEWEB)

Baimpas, Nikolaos, E-mail: nikolaos.baimpas@eng.ox.ac.uk [University of Oxford, Dept. of Engineering Science (United Kingdom); Le Bourhis, Eric [University of Poitiers, Institut P' , Laboratoire de Physique des Matériaux, Poitiers (France); Eve, Sophie [ENSICAEN, CRISMAT, Caen (France); Thiaudière, Dominique [Synchrotron SOLEIL, L' Orme des Merisiers Saint-Aubin, Paris (France); Hardie, Christopher [University of Oxford, Materials Department (United Kingdom); Korsunsky, Alexander M. [University of Oxford, Dept. of Engineering Science (United Kingdom)

2013-12-31

Nanocrystalline metallic coatings of sub-micron thickness are widely used in modern microelectronic applications. In X-ray diffraction experiments to determine both the residual and applied stresses in nanocrystalline coatings, one difficult challenge that comes up invariably is the determination of the strain-free lattice spacing d{sub o}. The present study addresses this challenge by using the focused ion beam (FIB) to generate a built-in strain-free reference by patterning (milling) a 50 × 50 μm{sup 2} region of the coating to produce an array of small stress-relieved “islands” ∼ 0.8 × 0.8 μm{sup 2} each. Transmission X-ray diffraction setup was used for data collection at DIFFABS beamline (Synchrotron SOLEIL, France). A 150 nm-thick multi-layered W–Cu nano-composite thin film on polyimide (Kapton®) substrate was studied. The samples were loaded incrementally using a compact uniaxial loading device, and micro-beam diffraction data were collected on and away from the reference array. It was shown experimentally that the “island” array remained approximately strain free throughout the experiment, providing an on-board d{sub o} lattice spacing reference. The changing lattice spacing d in the coating was also monitored away from the array, to deduce the elastic strain evolution during deformation. The results and their implications are presented and discussed. - Highlights: • In situ deformation study of laminate polycrystalline W–Cu thin films • Focused ion beam (FIB) patterning of an array of “islands” on thin films surface • X-ray diffraction on island-patterned region • Constant strain on “islands” independently of the deformation of the substrate.

Multiwavelength Absolute Phase Retrieval from Noisy Diffractive Patterns: Wavelength Multiplexing Algorithm

Directory of Open Access Journals (Sweden)

Vladimir Katkovnik

2018-05-01

Full Text Available We study the problem of multiwavelength absolute phase retrieval from noisy diffraction patterns. The system is lensless with multiwavelength coherent input light beams and random phase masks applied for wavefront modulation. The light beams are formed by light sources radiating all wavelengths simultaneously. A sensor equipped by a Color Filter Array (CFA is used for spectral measurement registration. The developed algorithm targeted on optimal phase retrieval from noisy observations is based on maximum likelihood technique. The algorithm is specified for Poissonian and Gaussian noise distributions. One of the key elements of the algorithm is an original sparse modeling of the multiwavelength complex-valued wavefronts based on the complex-domain block-matching 3D filtering. Presented numerical experiments are restricted to noisy Poissonian observations. They demonstrate that the developed algorithm leads to effective solutions explicitly using the sparsity for noise suppression and enabling accurate reconstruction of absolute phase of high-dynamic range.

the effect of the shape of atomic potential on the diffraction pattern of ...

African Journals Online (AJOL)

mansoor

potential applications(Lifshitz, 2003). Ferralis et al. (2004) investigatethe diffraction from One- and two dimensional quasicrystalline gratings” using two different approaches (laser diffraction and calculated diffraction method using. Fibonacci series). The work suggested that, laser diffraction allows an inductive approach for.

Diffraction experiments of argon or helium on polluted surfaces

International Nuclear Information System (INIS)

Berthier, J.P.; Constans, A.; Daury, G.; Lostis, P.

1975-01-01

Scattering patterns of molecular beams of argon or helium from metal surfaces (bulk metal or thin films) are reported. The pressure in the scattering chamber is about 10 -6 torr. So, the surfaces are polluted. Diffraction peaks are observed which can be interpreted very well by assuming that nitrogen, oxygen or carbon atoms are adsorbed of the surface. On the other hand, diffraction peaks from a silicon crystal have been observed which can be reproduced very well by using silicon crystal lattice. These experiments are not interpreted accurately, but show that molecular reflection can be used for some surface studies [fr

Diffraction-based BioCD biosensor for point-of-care diagnostics

Science.gov (United States)

Choi, H.; Chang, C.; Savran, C.; Nolte, D.

2018-02-01

The BioCD platform technology uses spinning-disk interferometry to detect molecular binding to target molecular probes in biological samples. Interferometric configurations have included differential phase contrast and in-line quadrature detection. For the detection of extremely low analyte concentrations, nano- or microparticles can enhance the signal through background-free diffraction detection. Diffraction signal measurements on BioCD biosensors are achieved by forming gratings on a disc surface. The grating pattern was printed with biotinylated bovine serum albumin (BSA) and streptavidin coated beads were deployed. The diameter of the beads was 1 micron and strong protein bonding occurs between BSA and streptavidin-coated beads at the printed location. The wavelength for the protein binding detection was 635 nm. The periodic pattern on the disc amplified scattered light into the first-order diffraction position. The diffracted signal contains Mie scattering and a randomly-distributed-bead noise contributions. Variation of the grating pattern periodicity modulates the diffraction efficiency. To test multiple spatial frequencies within a single scan, we designed a fan-shaped grating to perform frequency filter multiplexing on a diffraction-based BioCD.

Diffractive production off nuclei-shadow of hadronic bremsstrahlung

International Nuclear Information System (INIS)

Bialas, A.; Czyz, W.

1974-01-01

Diffractive production on nuclei is calculated using as an input a specific model for diffractive production on nucleons. In this model diffractive production is described as a shadow of non-diffractive multiple production of particles. The mechanism for non-diffractive production is taken to be hadronic bremsstrahlung of independently produced clusters. It is shown that such a model naturally explains the strikingly simple pattern of absorption observed in coherent production on nuclei. Possible generalizations of these results are indicated. (author)

Complex (Nonstandard) Six-Layer Polytypes of Lizardite Revealed from Oblique-Texture Electron Diffraction Patterns

International Nuclear Information System (INIS)

Zhukhlistov, A.P.; Zinchuk, N.N.; Kotel'nikov, D.D.

2004-01-01

Association of simple (1T and 3R) and two complex (nonstandard) orthogonal polytypes of the serpentine mineral lizardite from the Catoca kimberlite pipe (West Africa) association is revealed from oblique-texture electron diffraction patterns. A six-layer polytype with an ordered superposition of equally oriented layers (notation 3 2 3 2 3 4 3 4 3 6 3 6 or ++ - -00) belonging to the structural group A and a three-layer (336 or I,I,II) or a six-layer (336366 or I,I,II,I,II,II) polytype with alternating oppositely oriented layers and semi-disordered structure are identified using polytype analysis

A new approach of quantum mechanics for neutron single-slit diffraction

International Nuclear Information System (INIS)

Wu Xiangyao; Yang Jinghai; Liu Xiaojing; Wang Li; Liu Bing; Fan Xihui; Guo Yiqing

2007-01-01

Phenomena of electron, neutron, atomic and molecular diffraction have been studied in many experiments, and these experiments are explained by many theoretical works. We study neutron single-slit diffraction with a quantum mechanical approach. It is found that the obvious diffraction patterns can be obtained when the single slit width a is in the range of 3λ-60λ. We also find a new quantum effect of the thickness of single-slit which can make a large impact on the diffraction pattern. The new quantum effect predicted in our work can be tested by the neutron single-slit diffraction experiment. (authors)

The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements

Energy Technology Data Exchange (ETDEWEB)

Tong, Vivian, E-mail: v.tong13@imperial.ac.uk [Department of Materials, Imperial College London, Prince Consort Road, London SW7 2AZ (United Kingdom); Jiang, Jun [Department of Materials, Imperial College London, Prince Consort Road, London SW7 2AZ (United Kingdom); Wilkinson, Angus J. [Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH (United Kingdom); Britton, T. Ben [Department of Materials, Imperial College London, Prince Consort Road, London SW7 2AZ (United Kingdom)

2015-08-15

High resolution, cross-correlation-based, electron backscatter diffraction (EBSD) measures the variation of elastic strains and lattice rotations from a reference state. Regions near grain boundaries are often of interest but overlap of patterns from the two grains could reduce accuracy of the cross-correlation analysis. To explore this concern, patterns from the interior of two grains have been mixed to simulate the interaction volume crossing a grain boundary so that the effect on the accuracy of the cross correlation results can be tested. It was found that the accuracy of HR-EBSD strain measurements performed in a FEG-SEM on zirconium remains good until the incident beam is less than 18 nm from a grain boundary. A simulated microstructure was used to measure how often pattern overlap occurs at any given EBSD step size, and a simple relation was found linking the probability of overlap with step size. - Highlights: • Pattern overlap occurs at grain boundaries and reduces HR-EBSD accuracy. • A test is devised to measure the accuracy of HR-EBSD in the presence of overlap. • High pass filters can sometimes, but not generally, improve HR-EBSD measurements. • Accuracy of HR-EBSD remains high until the reference pattern intensity is <72%. • 9% of points near a grain boundary will have significant error for 200nm step size in Zircaloy-4.

Refractive-index determination of solids from first- and second-order critical diffraction angles of periodic surface patterns

International Nuclear Information System (INIS)

Meichner, Christoph; Kador, Lothar; Schedl, Andreas E.; Neuber, Christian; Kreger, Klaus; Schmidt, Hans-Werner

2015-01-01

We present two approaches for measuring the refractive index of transparent solids in the visible spectral range based on diffraction gratings. Both require a small spot with a periodic pattern on the surface of the solid, collimated monochromatic light, and a rotation stage. We demonstrate the methods on a polydimethylsiloxane film (Sylgard ® 184) and compare our data to those obtained with a standard Abbe refractometer at several wavelengths between 489 and 688 nm. The results of our approaches show good agreement with the refractometer data. Possible error sources are analyzed and discussed in detail; they include mainly the linewidth of the laser and/or the angular resolution of the rotation stage. With narrow-band light sources, an angular accuracy of ±0.025 ∘ results in an error of the refractive index of typically ±5 ⋅ 10 −4 . Information on the sample thickness is not required

rf streak camera based ultrafast relativistic electron diffraction.

Science.gov (United States)

Musumeci, P; Moody, J T; Scoby, C M; Gutierrez, M S; Tran, T

2009-01-01

We theoretically and experimentally investigate the possibility of using a rf streak camera to time resolve in a single shot structural changes at the sub-100 fs time scale via relativistic electron diffraction. We experimentally tested this novel concept at the UCLA Pegasus rf photoinjector. Time-resolved diffraction patterns from thin Al foil are recorded. Averaging over 50 shots is required in order to get statistics sufficient to uncover a variation in time of the diffraction patterns. In the absence of an external pump laser, this is explained as due to the energy chirp on the beam out of the electron gun. With further improvements to the electron source, rf streak camera based ultrafast electron diffraction has the potential to yield truly single shot measurements of ultrafast processes.

Blazed Grating Resonance Conditions and Diffraction Efficiency Optical Transfer Function

KAUST Repository

Stegenburgs, Edgars

2017-01-08

We introduce a general approach to study diffraction harmonics or resonances and resonance conditions for blazed reflecting gratings providing knowledge of fundamental diffraction pattern and qualitative understanding of predicting parameters for the most efficient diffraction.

Blazed Grating Resonance Conditions and Diffraction Efficiency Optical Transfer Function

KAUST Repository

Stegenburgs, Edgars; Alias, Mohd Sharizal B.; Ng, Tien Khee; Ooi, Boon S.

2017-01-01

We introduce a general approach to study diffraction harmonics or resonances and resonance conditions for blazed reflecting gratings providing knowledge of fundamental diffraction pattern and qualitative understanding of predicting parameters for the most efficient diffraction.

Neutron diffraction studies of water in meso- and micro-pores

International Nuclear Information System (INIS)

Steytler, D.C.; Dore, J.C.; Wright, C.J.

1982-07-01

Neutron diffraction studies have been made for D 2 O water in two high surface-area silica samples, Spherisorb and Gasil. The results show that the structural arrangement is similar to that of bulk water and that the modification due to the interface is restricted to a range of the order of 10 A or less. Measurements also indicate that the dispersed water undergoes significant structural changes with temperature variation but the behaviour is similar to that of the bulk liquid. The differences observed in the diffraction patterns can be partially described in terms of diffraction broadening due to the small volume of the dispersed water but there remains a significant variation which appears to be related to the hydrogen-bonding interactions. (author)

Ultrafast electron diffraction with megahertz MeV electron pulses from a superconducting radio-frequency photoinjector

Energy Technology Data Exchange (ETDEWEB)

Feng, L. W.; Lin, L.; Huang, S. L.; Quan, S. W.; Hao, J. K.; Zhu, F.; Wang, F.; Liu, K. X., E-mail: kxliu@pku.edu.cn [Institute of Heavy Ion Physics and State Key Laboratory of Nuclear Physics and Technology, Peking University, Beijing 100871 (China); Jiang, T.; Zhu, P. F.; Fu, F.; Wang, R.; Zhao, L.; Xiang, D., E-mail: dxiang@sjtu.edu.cn [Key Laboratory for Laser Plasmas (Ministry of Education), Department of Physics and Astronomy, Shanghai Jiao Tong University, Shanghai 200240 (China); IFSA Collaborative Innovation Center, Shanghai Jiao Tong University, Shanghai 200240 (China)

2015-11-30

We report ultrafast relativistic electron diffraction operating at the megahertz repetition rate where the electron beam is produced in a superconducting radio-frequency (rf) photoinjector. We show that the beam quality is sufficiently high to provide clear diffraction patterns from gold and aluminium samples. With the number of electrons, several orders of magnitude higher than that from a normal conducting photocathode rf gun, such high repetition rate ultrafast MeV electron diffraction may open up many new opportunities in ultrafast science.

Laser diffraction analysis of colloidal crystals

Energy Technology Data Exchange (ETDEWEB)

Sogami, Ikuo S.; Shinohara, Tadatomi; Yoshiyama, Tsuyoshi [Kyoto Sangyo Univ., Department of Physics, Kyoto (Japan)

2001-10-01

Laser diffraction analysis is made on crystallization in salt-free aqueous suspensions of highly-charged colloidal particles for semi-dilute specimens of concentration 0.1-10.0 vol%. Kossel diffraction patterns which represent faithfully accurate information on lattice symmetries in the suspensions enable us to investigate the time evolution of colloidal crystals. The results show that the crystallization proceeds by way of the following intermediate phase transitions: two-dimensional hcp structure {yields} random layer structure {yields} layer structure with one sliding degree of freedom {yields} stacking disorder structure {yields} stacking structure with multivariant periodicity {yields} fcc twin structure with twin plane (111) {yields} normal fcc structure {yields} bcc twin structure with twin plane (11-bar2) or (1-bar12) {yields} normal bcc structure. For concentrated suspensions (>2 vol %), the phase transition ceases to proceed at the normal fcc structure. (author)

Laser diffraction analysis of colloidal crystals

International Nuclear Information System (INIS)

Sogami, Ikuo S.; Shinohara, Tadatomi; Yoshiyama, Tsuyoshi

2001-01-01

Laser diffraction analysis is made on crystallization in salt-free aqueous suspensions of highly-charged colloidal particles for semi-dilute specimens of concentration 0.1-10.0 vol%. Kossel diffraction patterns which represent faithfully accurate information on lattice symmetries in the suspensions enable us to investigate the time evolution of colloidal crystals. The results show that the crystallization proceeds by way of the following intermediate phase transitions: two-dimensional hcp structure → random layer structure → layer structure with one sliding degree of freedom → stacking disorder structure → stacking structure with multivariant periodicity → fcc twin structure with twin plane (111) → normal fcc structure → bcc twin structure with twin plane (11-bar2) or (1-bar12) → normal bcc structure. For concentrated suspensions (>2 vol %), the phase transition ceases to proceed at the normal fcc structure. (author)

When holography meets coherent diffraction imaging.

Science.gov (United States)

Latychevskaia, Tatiana; Longchamp, Jean-Nicolas; Fink, Hans-Werner

2012-12-17

The phase problem is inherent to crystallographic, astronomical and optical imaging where only the intensity of the scattered signal is detected and the phase information is lost and must somehow be recovered to reconstruct the object's structure. Modern imaging techniques at the molecular scale rely on utilizing novel coherent light sources like X-ray free electron lasers for the ultimate goal of visualizing such objects as individual biomolecules rather than crystals. Here, unlike in the case of crystals where structures can be solved by model building and phase refinement, the phase distribution of the wave scattered by an individual molecule must directly be recovered. There are two well-known solutions to the phase problem: holography and coherent diffraction imaging (CDI). Both techniques have their pros and cons. In holography, the reconstruction of the scattered complex-valued object wave is directly provided by a well-defined reference wave that must cover the entire detector area which often is an experimental challenge. CDI provides the highest possible, only wavelength limited, resolution, but the phase recovery is an iterative process which requires some pre-defined information about the object and whose outcome is not always uniquely-defined. Moreover, the diffraction patterns must be recorded under oversampling conditions, a pre-requisite to be able to solve the phase problem. Here, we report how holography and CDI can be merged into one superior technique: holographic coherent diffraction imaging (HCDI). An inline hologram can be recorded by employing a modified CDI experimental scheme. We demonstrate that the amplitude of the Fourier transform of an inline hologram is related to the complex-valued visibility, thus providing information on both, the amplitude and the phase of the scattered wave in the plane of the diffraction pattern. With the phase information available, the condition of oversampling the diffraction patterns can be relaxed, and the

Automatic control unit for A neutron diffraction crystal spectrometer

Energy Technology Data Exchange (ETDEWEB)

Adib, M.; Abbas, Y.; Mostafa, M.; Hamouda, I.

1982-01-01

An automatic transistorized unit has been designed and constructed to control the operation of the double axis crystal spectrometer installed in front of one of the horizontal channels of the ET-RR-1 reactor. The function of the automatic unit is to store the diffracted neutrons at a certain angle with respect to the direction of the incident neutron beam in a selected channel of a 1024-multichannel analyzer for a certain preadjusted time period. AT the end of this time period the unit rotates the spectrometer's arm to another angle, selects the next channel of the MCA and provides the measurement of the diffracted neutron for the same time period. Such a sequence is repeated automatically over all angles required for the neutron diffraction pattern of the sample under investigation. As a result, the stored information at the MCA provides the neutron diffraction pattern as a function of channel number, where each channel corresponds to a certain scattering angle. The stored distribution at MCA can be obtained through the analyzer read out unit. The designed automatic unit has the possibility of providing the neutron diffraction pattern using a 6-digit scaler and a printer.

Accurate Charge Densities from Powder Diffraction

DEFF Research Database (Denmark)

Bindzus, Niels; Wahlberg, Nanna; Becker, Jacob

Synchrotron powder X-ray diffraction has in recent years advanced to a level, where it has become realistic to probe extremely subtle electronic features. Compared to single-crystal diffraction, it may be superior for simple, high-symmetry crystals owing to negligible extinction effects and minimal...... peak overlap. Additionally, it offers the opportunity for collecting data on a single scale. For charge densities studies, the critical task is to recover accurate and bias-free structure factors from the diffraction pattern. This is the focal point of the present study, scrutinizing the performance...

Classification of glutinous rice (Oryza sativa L.) starches based on X-ray diffraction pattern

Energy Technology Data Exchange (ETDEWEB)

Zhang, Q.; Abe, T.; Ando, H.; Sasahara, T.

1993-07-01

This study was carried out to analyse the cultivar variability of the X-ray diffraction pattern of glutinous rice starches. Four peaks in the X-ray diffractograms were identified, i.e. 3b, 4a, 4b and 6a. The four peaks were measured from the base line for 71 cultivars and three M{sub 3} lines which were irradiated by γ-rays at the rates of 10, 20 and 30 kr, respectively. Glutinous rice starches were classified into two types by discriminant analysis based on the values of 3b/4b, 4a/4b and 6a/4b. The X-ray diffraction type of the three cultivars did not change with the cultivation areas of different latitude, while that of eleven cultivars varied. Degree of crystallinity was estimated using the formula, (I{sub max} — I{sub i})/I{sub max} where I{sub max} is the maximum height from background intensity line among cultivars, and I{sub i} represents the four peaks. These ratios indicated that the changes in the order of crystallinity were similar to those with the water content and/or hydration and temperature for gelatinization among and/or within cultivars. (author)

X-ray diffraction from thin films : Size/strain analysis and whole pattern fitting

Energy Technology Data Exchange (ETDEWEB)

Scardi, P [Trento Univ. (Italy). Dept. of Materials Engineering

1996-09-01

Line Profile Analysis (LPA) and whole pattern fitting may be used with success for the characterization of thin films from XRD data collected with the traditional Bragg-Brentano geometry. The size/strain analysis was conducted by an integrated procedure of profile modelling-assisted Fourier analysis, in order to measure the content of lattice imperfections and crystalline domain size along the growth direction in heteroepitaxial thin films. The microstructure of these films is typical of several PVD processes for the production of highly textured and low-defect thin crystalline layers. The same analysis could be conducted on random thin films as well, and in this case it is possible to determine an average crystallite size and shape. As will be shown in the paper, structural and microstructural parameters obtained by these methods may be correlated with thin film properties of technological interest. The whole pattern analysis may be used to obtain the information contained in a wide region of the diffraction pattern. This approach, currently used for the quantitative analysis of phase mixtures in traditional powder samples, was modified to account both for the size/strain effects, according to a simplified LPA, and for the structure of thin films and multi-layer systems. In this way, a detailed analysis based on a structural model for the present phases can be performed considering the real geometry of these samples. In particular, the quantitative phase analysis could be conducted in terms of layer thickness instead of volume or weight fractions.

X-ray diffraction from thin films : Size/strain analysis and whole pattern fitting

International Nuclear Information System (INIS)

Scardi, P.

1996-01-01

Line Profile Analysis (LPA) and whole pattern fitting may be used with success for the characterization of thin films from XRD data collected with the traditional Bragg-Brentano geometry. The size/strain analysis was conducted by an integrated procedure of profile modelling-assisted Fourier analysis, in order to measure the content of lattice imperfections and crystalline domain size along the growth direction in heteroepitaxial thin films. The microstructure of these films is typical of several PVD processes for the production of highly textured and low-defect thin crystalline layers. The same analysis could be conducted on random thin films as well, and in this case it is possible to determine an average crystallite size and shape. As will be shown in the paper, structural and microstructural parameters obtained by these methods may be correlated with thin film properties of technological interest. The whole pattern analysis may be used to obtain the information contained in a wide region of the diffraction pattern. This approach, currently used for the quantitative analysis of phase mixtures in traditional powder samples, was modified to account both for the size/strain effects, according to a simplified LPA, and for the structure of thin films and multi-layer systems. In this way, a detailed analysis based on a structural model for the present phases can be performed considering the real geometry of these samples. In particular, the quantitative phase analysis could be conducted in terms of layer thickness instead of volume or weight fractions

Submicron resolution X-ray diffraction from periodically patterned GaAs nanorods grown onto Ge[111

Energy Technology Data Exchange (ETDEWEB)

Davydok, Anton; Biermanns, Andreas; Pietsch, Ullrich [Solid State Physics, Siegen University (Germany); Grenzer, Joerg [FZ-Dresden Rossendorf, Dresden (Germany); Paetzelt, Hendrik; Gottschalch, Volker; Bauer, Jens [Solid State Chemistry, University of Leipzig (Germany)

2009-08-15

We present high-resolution X-ray diffraction pattern of periodic GaAs nanorods (NRs) ensembles and individual GaAs NRs grown catalyst-free throughout a pre-patterned amorphous SiN{sub x} mask onto Ge[111]B surfaces by selective-area MOVPE method. To the best of our knowledge this is the first report about nano-structure X-ray characterization growth on non-polar substrate. The experiment has been performed at home laboratory and using synchrotron radiation using a micro-sized beam prepared by compound refractive lenses. Due to the non-polar character of the substrate the shapes of NRs appear not uniform and vary between deformed hexagonal and trigonal in symmetry. Because the average diameter of NRs equals the experimental resolution certain cuts through slightly inclined edges or corners of individual NRs with lateral size of about 225 nm could be selected using spatially resolved reciprocal space mapping. (Abstract Copyright [2009], Wiley Periodicals, Inc.)

Influence of preferred orientation of minerals in the mineralogical identification process by X-ray diffraction

Energy Technology Data Exchange (ETDEWEB)

Silva, Amanda Luzia da; Oliveira, Arno H. de [Universidade Federal de Minas Gerais (DEN/UFMG), Belo Horizonte, MG (Brazil). Dept. de Engenharia Nuclear; Fernandes, Maria Lourdes Souza, E-mail: lourdesfernandes@ufmg.b [Universidade Federal de Minas Gerais (UFMG), Belo Horizonte, MG (Brazil). Inst. de GeoCiencias. Centro de Pesquisa Professor Manoel Teixeira da Costa

2011-07-01

The X-ray diffraction corresponds to one of the main techniques for characterization of microstructures in crystalline materials, widely used in the identification of minerals in samples of geological materials. Some minerals have a property called preferred orientation which corresponds to the orientation tendency of the crystals of ground minerals to orient themselves in certain directions according to a preferred crystallographic plane. This property affects the analysis by X-ray diffraction and this fact can generates erroneous results in the characterization. The purpose of this study is to identify the negative influence of the preferred orientation of a mineral in the generation of diffraction patterns obtained in the X-ray diffraction analysis. For this, a sample of muscovite, a mineral of mica group, was prepared by two different methods: the frontal method and the back loading method. In the analysis using the frontal method there was displacement of the XRD pattern in the abscissa axis, where it was observed changes in interplanar distance and angle 2{theta} values, which are essential information for characterization and identification of a mineral. In the analysis using the back loading method, the generated XRD pattern showed no displacement in the axis of abscissas and showed interplanar distance and angle 2{theta} values closer to the real values for the muscovite. The results showed that one can only make improvements to the process of sample preparation minimizing the effect of preferred orientation in the analysis. There is no need to change conditions of diffractometer measurements. (author)

Influence of preferred orientation of minerals in the mineralogical identification process by X-ray diffraction

International Nuclear Information System (INIS)

Silva, Amanda Luzia da; Oliveira, Arno H. de; Fernandes, Maria Lourdes Souza

2011-01-01

The X-ray diffraction corresponds to one of the main techniques for characterization of microstructures in crystalline materials, widely used in the identification of minerals in samples of geological materials. Some minerals have a property called preferred orientation which corresponds to the orientation tendency of the crystals of ground minerals to orient themselves in certain directions according to a preferred crystallographic plane. This property affects the analysis by X-ray diffraction and this fact can generates erroneous results in the characterization. The purpose of this study is to identify the negative influence of the preferred orientation of a mineral in the generation of diffraction patterns obtained in the X-ray diffraction analysis. For this, a sample of muscovite, a mineral of mica group, was prepared by two different methods: the frontal method and the back loading method. In the analysis using the frontal method there was displacement of the XRD pattern in the abscissa axis, where it was observed changes in interplanar distance and angle 2θ values, which are essential information for characterization and identification of a mineral. In the analysis using the back loading method, the generated XRD pattern showed no displacement in the axis of abscissas and showed interplanar distance and angle 2θ values closer to the real values for the muscovite. The results showed that one can only make improvements to the process of sample preparation minimizing the effect of preferred orientation in the analysis. There is no need to change conditions of diffractometer measurements. (author)

Time-resolved diffraction studies of muscle using synchrotron radiation

International Nuclear Information System (INIS)

Harford, Jeffrey; Squire, John

1997-01-01

Muscle contraction is one of those biological phenomena that we can all appreciate in our everyday lives. Sometimes it is when we are resting quietly and are aware of our heartbeat. At other times it may be when we are exerting ourselves and become short of breath, or when we exercise for a long period and our muscles start to ache. The way in which muscles produce force has exercised the minds of philosophers and scientists at least since the days of Erasistratus in the third century BC. Nowadays, of course, we know a very great deal about muscle structure, physiology and biochemistry, but we still do not know exactly what the molecular process is that produces movement. An ideal way of probing this process would be to be able to obtain signals from the relevant molecules as they actually go through their normal force-generating routine in an active muscle. The spatial dimensions involved are in the region of 1-50 nm, thus precluding the use of light microscopy, and the time regime is microseconds to milliseconds. Techniques with the appropriate spatial resolution might be electron microscopy and x-ray diffraction, but electron microscopy cannot yet be carried out on living tissue. X-ray diffraction methods can clearly have the right sort of spatial resolution, but what about recording diffraction patterns in the very short times involved (say 1 ms)? It is here that the high flux from synchrotron storage rings comes into its own. Using synchrotron radiation from, say, the SRS at the CCLRC Daresbury Laboratory it is possible to record x-ray diffraction patterns from living muscles in the millisecond time regime and to follow how these diffraction patterns change as the muscles go through typical contraction cycles. Unfortunately, x-ray diffraction is not a direct imaging method; the observed distribution of diffracted intensity needs to be interpreted in some way to give useful information on the spatial relationships of the force-generating molecules. This review

High throughput screening of ligand binding to macromolecules using high resolution powder diffraction

Science.gov (United States)

Von Dreele, Robert B.; D'Amico, Kevin

2006-10-31

A process is provided for the high throughput screening of binding of ligands to macromolecules using high resolution powder diffraction data including producing a first sample slurry of a selected polycrystalline macromolecule material and a solvent, producing a second sample slurry of a selected polycrystalline macromolecule material, one or more ligands and the solvent, obtaining a high resolution powder diffraction pattern on each of said first sample slurry and the second sample slurry, and, comparing the high resolution powder diffraction pattern of the first sample slurry and the high resolution powder diffraction pattern of the second sample slurry whereby a difference in the high resolution powder diffraction patterns of the first sample slurry and the second sample slurry provides a positive indication for the formation of a complex between the selected polycrystalline macromolecule material and at least one of the one or more ligands.

Crystallized solids characterization by X-ray diffraction

International Nuclear Information System (INIS)

Broll, N.

1996-01-01

This work deals with the crystallized solids characterization by X-ray diffraction. The powders diffraction principle is described. Then are given the different powders diffraction experimental methods. An X-ray diffraction device is essentially constituted of three parts: the X-rays source, the sample and the detector. The source is usually constituted by an X-rays tube whereas the sample can be fixed on a photographic chamber or put on a goniometer. The different photographic chambers which can be used (Debye-Scherrer, Seeman-Bohlin and Guinier) are described. The powders diffractometer the most used is a Bragg-Brentano focusing diffractometer because it allows to obtain very sharp spectral lines and an important diffracted intensity. The detectors which are the mainly used are the scintillation counters. The most important use in powders diffractometry is the identification of the different phases of a sample. The phases identification consists to compare the unknown sample spectrum at those of standard materials indexed until now. Two methods exist at present. They are explained and their limits in the phases search are given. Another use of the X-ray diffraction is the quantitative analysis. It consists to determine the concentrations of each crystal phases of a sample. The principles of these quantitative methods are given. The lattice parameters of a polycrystal material can be determined from its X-ray pattern too with a very high precision. The way to index powders patterns is given. The residual stresses of materials can also be estimated. The principle of this measured method is explained. It is at last possible to study from an X-ray pattern, the material grain orientations during the different steps of preparation and working. (O.M.). 13 refs., 19 figs., 1 tab

NIST/Sandia/ICDD Electron Diffraction Database: A Database for Phase Identification by Electron Diffraction.

Science.gov (United States)

Carr, M J; Chambers, W F; Melgaard, D; Himes, V L; Stalick, J K; Mighell, A D

1989-01-01

A new database containing crystallographic and chemical information designed especially for application to electron diffraction search/match and related problems has been developed. The new database was derived from two well-established x-ray diffraction databases, the JCPDS Powder Diffraction File and NBS CRYSTAL DATA, and incorporates 2 years of experience with an earlier version. It contains 71,142 entries, with space group and unit cell data for 59,612 of those. Unit cell and space group information were used, where available, to calculate patterns consisting of all allowed reflections with d -spacings greater than 0.8 A for ~ 59,000 of the entries. Calculated patterns are used in the database in preference to experimental x-ray data when both are available, since experimental x-ray data sometimes omits high d -spacing data which falls at low diffraction angles. Intensity data are not given when calculated spacings are used. A search scheme using chemistry and r -spacing (reciprocal d -spacing) has been developed. Other potentially searchable data in this new database include space group, Pearson symbol, unit cell edge lengths, reduced cell edge length, and reduced cell volume. Compound and/or mineral names, formulas, and journal references are included in the output, as well as pointers to corresponding entries in NBS CRYSTAL DATA and the Powder Diffraction File where more complete information may be obtained. Atom positions are not given. Rudimentary search software has been written to implement a chemistry and r -spacing bit map search. With typical data, a full search through ~ 71,000 compounds takes 10~20 seconds on a PDP 11/23-RL02 system.

Holographic Reconstruction of Photoelectron Diffraction and Its Circular Dichroism for Local Structure Probing

Science.gov (United States)

Matsui, Fumihiko; Matsushita, Tomohiro; Daimon, Hiroshi

2018-06-01

The local atomic structure around a specific element atom can be recorded as a photoelectron diffraction pattern. Forward focusing peaks and diffraction rings around them indicate the directions and distances from the photoelectron emitting atom to the surrounding atoms. The state-of-the-art holography reconstruction algorithm enables us to image the local atomic arrangement around the excited atom in a real space. By using circularly polarized light as an excitation source, the angular momentum transfer from the light to the photoelectron induces parallax shifts in these diffraction patterns. As a result, stereographic images of atomic arrangements are obtained. These diffraction patterns can be used as atomic-site-resolved probes for local electronic structure investigation in combination with spectroscopy techniques. Direct three-dimensional atomic structure visualization and site-specific electronic property analysis methods are reviewed. Furthermore, circular dichroism was also found in valence photoelectron and Auger electron diffraction patterns. The investigation of these new phenomena provides hints for the development of new techniques for local structure probing.

A review and reassessment of diffraction, scattering, and shadows in electrodynamics

Science.gov (United States)

Berg, Matthew J.; Sorensen, Christopher M.

2018-05-01

The concepts of diffraction and scattering are well known and considered fundamental in optics and other wave phenomena. For any type of wave, one way to define diffraction is the spreading of waves, i.e., no change in the average propagation direction, while scattering is the deflection of waves with a clear change of propagation direction. However, the terms "diffraction" and "scattering" are often used interchangeably, and hence, a clear distinction between the two is difficult to find. This review considers electromagnetic waves and retains the simple definition that diffraction is the spreading of waves but demonstrates that all diffraction patterns are the result of scattering. It is shown that for electromagnetic waves, the "diffracted" wave from an object is the Ewald-Oseen extinction wave in the far-field zone. The intensity distribution of this wave yields what is commonly called the diffraction pattern. Moreover, this is the same Ewald-Oseen wave that cancels the incident wave inside the object and thereafter continues to do so immediately behind the object to create a shadow. If the object is much wider than the beam but has a hole, e.g., a screen with an aperture, the Ewald-Oseen extinction wave creates the shadow behind the screen and the incident light that passes through the aperture creates the diffraction pattern. This point of view also illustrates Babinet's principle. Thus, it is the Ewald-Oseen extinction theorem that binds together diffraction, scattering, and shadows.

Multi-order nonlinear diffraction in second harmonic generation

DEFF Research Database (Denmark)

Saltiel, S. M.; Neshev, D.; Krolikowski, Wieslaw

We analyze the emission patterns in the process of second harmonic (SH) generation in χ(2) nonlinear gratings and identify for the first time, to the best of our knowledge, the evidence of Raman-Nath type nonlinear diffraction in frequency doubling processes.......We analyze the emission patterns in the process of second harmonic (SH) generation in χ(2) nonlinear gratings and identify for the first time, to the best of our knowledge, the evidence of Raman-Nath type nonlinear diffraction in frequency doubling processes....

Neutron diffraction studies on cobalt substituted BiFeO3

Science.gov (United States)

Ray, J.; Biswal, A. K.; Acharya, S.; Babu, P. D.; Siruguri, V.; Vishwakarma, P. N.

2013-02-01

A dilute concentration of single phase Cobalt substituted Bismuth ferrite, BiFe1-XCoXO3; (x=0, 0.02) is prepared by sol-gel auto combustion method. Room temperature neutron diffraction patterns show no change in the crystal and magnetic structure upon cobalt doping. The calculation of magnetic moments shows 3.848 μB for Fe+ and 2.85 μB for Co3+. The cobalt is found to be in intermediate spin state.

International Centre for Diffraction Data (ICDD)

International Nuclear Information System (INIS)

Hubbard, C.R.; O'Connor, B.H.

2002-01-01

Full text: The ICDD is a not-for-profit organisation comprising approximately 300 of the world's leading x-ray scientists. It is dedicated to collecting, editing, publishing and distributing powder diffraction data for the identification of crystalline materials. The membership of the ICDD consists of worldwide representation from academe, government and industry. It is our mission to continue as the world centre for quality x-ray powder diffraction data to meet the needs of the technical community. Through the combined efforts of the members and its staff of 40 at ICDD Headquarters, the organisation serves the x-ray analysis community (i) by producing the ICDD Powder Diffraction File (PDF) and other data base products for materials characterisation; (ii) through x-ray analysis education programs and conference management (including the Denver X-ray Conference); and (iii) through philanthropic initiatives such as scholarship support for postgraduate students working in the field. The current Release 2001 of the PDF (PDF-2) contains 87,500 measured patterns and 49,000 patterns calculated from the ICSD database. The number of PDF patterns in this latest release has increased by approximately 3,000, including some 2,500 measured patterns. The quality of the database is being continuously improved through the organisation's Grant-in-Aid program whereby diffractionists around the world contribute to the measurement of patterns for new materials and to the improvement of existing PDF data. The organisation is devoting much attention to the needs of the bioscience community. The database will soon feature a much-expanded set of patterns for organic, polymer, pharmaceutical and biomaterials. The ICDD is about to release a relational database (RDB) version of the PDF (PDF-4) which will give users a very sophisticated tool for data mining. The PDF-4 will provide a quantum leap in data mining techniques, and will soon lead to the PDF being cross-linked to other diffraction

Diffraction from the perspective of the spatial coherence wavelets

International Nuclear Information System (INIS)

Castaneda, R.; Carrasquilla-Alvarez, J.; Garcia-Sucerquia, J.

2005-10-01

The diffraction of spatially partially coherent optical fields is analysed by using two concepts recently introduced by the authors: the spatial coherence wavelets and the effective diffracting aperture. Within this framework, the intimate link between the spatial properties of the optical field and the aperture's edges in the diffraction phenomena is studied. New insight is proposed in regard to the diffraction in the Fresnel - Fraunhofer approximation. Our ideas are supported by numerical calculations and analysis of the diffraction patterns obtained when an optical field with adjustable spatial coherence impinges upon a circular aperture (author)

An automatic control unit for A neutron diffraction crystal spectrometer

International Nuclear Information System (INIS)

Adib, M.; Abbas, Y.; Mostafa, M.; Hamouda, I.

1982-01-01

An automatic transistorized unit has been designed and constructed to control the operation of the double axis crystal spectrometer installed in front of one of the horizontal channels of the ET-RR-1 reactor. The function of the automatic unit is to store the diffracted neutrons at a certain angle with respect to the direction of the incident neutron beam in a selected channel of a 1024-multichannel analyzer for a certain preadjusted time period. AT the end of this time period the unit rotates the spectrometer's arm to another angle, selects the next channel of the MCA and provides the measurement of the diffracted neutron for the same time period. Such a sequence is repeated automatically over all angles required for the neutron diffraction pattern of the sample under investigation. As a result, the stored information at the MCA provides the neutron diffraction pattern as a function of channel number, where each channel corresponds to a certain scattering angle. The stored distribution at MCA can be obtained through the analyzer read out unit. The designed automatic unit has the possibility of providing the neutron diffraction pattern using a 6-digit scaler and a printer

Three-dimensional nanostructure determination from a large diffraction data set recorded using scanning electron nanodiffraction

Directory of Open Access Journals (Sweden)

Yifei Meng

2016-09-01

Full Text Available A diffraction-based technique is developed for the determination of three-dimensional nanostructures. The technique employs high-resolution and low-dose scanning electron nanodiffraction (SEND to acquire three-dimensional diffraction patterns, with the help of a special sample holder for large-angle rotation. Grains are identified in three-dimensional space based on crystal orientation and on reconstructed dark-field images from the recorded diffraction patterns. Application to a nanocrystalline TiN thin film shows that the three-dimensional morphology of columnar TiN grains of tens of nanometres in diameter can be reconstructed using an algebraic iterative algorithm under specified prior conditions, together with their crystallographic orientations. The principles can be extended to multiphase nanocrystalline materials as well. Thus, the tomographic SEND technique provides an effective and adaptive way of determining three-dimensional nanostructures.

Surface segregation of InGaAs films by the evolution of reflection high-energy electron diffraction patterns

International Nuclear Information System (INIS)

Zhou Xun; Luo Zi-Jiang; Guo Xiang; Zhang Bi-Chan; Shang Lin-Tao; Zhou Qing; Deng Chao-Yong; Ding Zhao

2012-01-01

Surface segregation is studied via the evolution of reflection high-energy electron diffraction (RHEED) patterns under different values of As 4 BEP for InGaAs films. When the As 4 BEP is set to be zero, the RHEED pattern keeps a 4×3/(n × 3) structure with increasing temperature, and surface segregation takes place until 470 °C. The RHEED pattern develops into a metal-rich (4 × 2) structure as temperature increases to 495 °C. The reason for this is that surface segregation makes the In inside the InGaAs film climb to its surface. With the temperature increasing up to 515 °C, the RHEED pattern turns into a GaAs(2 × 4) structure due to In desorption. While the As 4 BEP comes up to a specific value (1.33 × 10 -4 Pa−1.33 × 10 -3 Pa), the surface temperature can delay the segregation and desorption. We find that As 4 BEP has a big influence on surface desorption, while surface segregation is more strongly dependent on temperature than surface desorption. (condensed matter: structural, mechanical, and thermal properties)

Bragg's Law diffraction simulations for electron backscatter diffraction analysis

International Nuclear Information System (INIS)

Kacher, Josh; Landon, Colin; Adams, Brent L.; Fullwood, David

2009-01-01

In 2006, Angus Wilkinson introduced a cross-correlation-based electron backscatter diffraction (EBSD) texture analysis system capable of measuring lattice rotations and elastic strains to high resolution. A variation of the cross-correlation method is introduced using Bragg's Law-based simulated EBSD patterns as strain free reference patterns that facilitates the use of the cross-correlation method with polycrystalline materials. The lattice state is found by comparing simulated patterns to collected patterns at a number of regions on the pattern using the cross-correlation function and calculating the deformation from the measured shifts of each region. A new pattern can be simulated at the deformed state, and the process can be iterated a number of times to converge on the absolute lattice state. By analyzing an iteratively rotated single crystal silicon sample and recovering the rotation, this method is shown to have an angular resolution of ∼0.04 o and an elastic strain resolution of ∼7e-4. As an example of applications, elastic strain and curvature measurements are used to estimate the dislocation density in a single grain of a compressed polycrystalline Mg-based AZ91 alloy.

Neutron diffraction study of history dependence in MnFeP0.6Si0.4

International Nuclear Information System (INIS)

Zhang, L.; Moze, O.; Prokes, K.; Tegus, O.; Brueck, E.

2005-01-01

In the MnFe(P,As) compounds which are promising magnetorefrigerant materials, we have studied the effect of Si substitution and successfully replaced As by Si. Surprisingly besides all the other changes, a peculiar history dependence of the magnetic phase transition was disclosed. The as-prepared sample shows a significantly lower transition temperature (namely a virgin T C ) than the sample that has experienced thermal cycling. The neutron diffraction patterns recorded during the first cooling manifest the first-order and magnetic-field-induced characters of the virgin phase transition. However, the refinement of the diffraction patterns does not provide evidence for atomic-position swapping, which might account for this history dependence

Coded diffraction system in X-ray crystallography using a boolean phase coded aperture approximation

Science.gov (United States)

Pinilla, Samuel; Poveda, Juan; Arguello, Henry

2018-03-01

Phase retrieval is a problem present in many applications such as optics, astronomical imaging, computational biology and X-ray crystallography. Recent work has shown that the phase can be better recovered when the acquisition architecture includes a coded aperture, which modulates the signal before diffraction, such that the underlying signal is recovered from coded diffraction patterns. Moreover, this type of modulation effect, before the diffraction operation, can be obtained using a phase coded aperture, just after the sample under study. However, a practical implementation of a phase coded aperture in an X-ray application is not feasible, because it is computationally modeled as a matrix with complex entries which requires changing the phase of the diffracted beams. In fact, changing the phase implies finding a material that allows to deviate the direction of an X-ray beam, which can considerably increase the implementation costs. Hence, this paper describes a low cost coded X-ray diffraction system based on block-unblock coded apertures that enables phase reconstruction. The proposed system approximates the phase coded aperture with a block-unblock coded aperture by using the detour-phase method. Moreover, the SAXS/WAXS X-ray crystallography software was used to simulate the diffraction patterns of a real crystal structure called Rhombic Dodecahedron. Additionally, several simulations were carried out to analyze the performance of block-unblock approximations in recovering the phase, using the simulated diffraction patterns. Furthermore, the quality of the reconstructions was measured in terms of the Peak Signal to Noise Ratio (PSNR). Results show that the performance of the block-unblock phase coded apertures approximation decreases at most 12.5% compared with the phase coded apertures. Moreover, the quality of the reconstructions using the boolean approximations is up to 2.5 dB of PSNR less with respect to the phase coded aperture reconstructions.

Analysis of x-ray diffraction pattern and complex plane impedance plot of polypyrrole/titanium dioxide nanocomposite: A simulation study

Science.gov (United States)

Ravikiran, Y. T.; Vijaya Kumari, S. C.

2013-06-01

To innovate the properties of Polypyrrole/Titanium dioxide (PPy/TiO2) nanocomposite further, it has been synthesized by chemical polymerization technique. The nanostructure and monoclinic phase of the prepared composite have been confirmed by simulating the X-ray diffraction pattern (XRD). Also, complex plane impedance plot of the composite has been simulated to find equivalent resistance capacitance circuit (RC circuit) and numerical values of R and C have been predicted.

Self-diffraction and Z-scan studies in organic dye doped thin films

International Nuclear Information System (INIS)

Madhana Sundari, R.; Palanisamy, P.K.

2006-01-01

Self-diffraction in Acid Red 87 (eosin Y) dye doped thin films is studied using argon ion laser (514.5 nm). Growth of self-diffraction grating is monitored by measuring intensities of various diffraction orders. This study has resulted in the observation of phase variation between the contributing beams in any diffracted order. This change of phase is measured at various stages of grating formation. Due to self-phase modulation, circular concentric rings pattern is obtained in the far field. The observed fluctuation in this pattern may be due to the phase variation between the contributing beams in any diffracted order. Z-scan technique is used to study the optical non-linearity of the sample

Diffraction of radiation from channelled charged particles

International Nuclear Information System (INIS)

Baryshevskij, V.G.; Grubich, A.O.; Dubovskaya, I.Ya.

1978-01-01

An explicit expression for cross-section and radiation spectrum at diffraction is calculated. It is shown that photons emitted by channelled particles form a typical diffraction pattern which contains information about the crystal structure. It is also shown that the change of the longitudinal energy of the particle caused by the radiation braking becomes important when the particle energy is increased. (author)

Phase behavior in diffraction

International Nuclear Information System (INIS)

Checon, A.

1983-01-01

Theoretical formulation of a straight edge diffraction shows a phase difference of π/2 between the incoming and diffracted waves. Experiments using two straight edges do not confirm the π/2 difference but suggest that the incoming wave is in phase with the wave diffracted into the shadowed region of the edge and out of phase by a factor of π with the wave diffracted into the illuminated region. (Author) [pt

The Gaussian beam mode analysis of classical phase aberrations in diffraction-limited optical systems

International Nuclear Information System (INIS)

Trappe, Neil; Murphy, J Anthony; Withington, Stafford

2003-01-01

Gaussian beam mode analysis (GBMA) offers a more intuitive physical insight into how light beams evolve as they propagate than the conventional Fresnel diffraction integral approach. In this paper we illustrate that GBMA is a computationally efficient, alternative technique for tracing the evolution of a diffracting coherent beam. In previous papers we demonstrated the straightforward application of GBMA to the computation of the classical diffraction patterns associated with a range of standard apertures. In this paper we show how the GBMA technique can be expanded to investigate the effects of aberrations in the presence of diffraction by introducing the appropriate phase error term into the propagating quasi-optical beam. We compare our technique to the standard diffraction integral calculation for coma, astigmatism and spherical aberration, taking - for comparison - examples from the classic text 'Principles of Optics' by Born and Wolf. We show the advantages of GBMA for allowing the defocusing of an aberrated image to be evaluated quickly, which is particularly important and useful for probing the consequences of astigmatism and spherical aberration

The Gaussian beam mode analysis of classical phase aberrations in diffraction-limited optical systems

Science.gov (United States)

Trappe, Neil; Murphy, J. Anthony; Withington, Stafford

2003-07-01

Gaussian beam mode analysis (GBMA) offers a more intuitive physical insight into how light beams evolve as they propagate than the conventional Fresnel diffraction integral approach. In this paper we illustrate that GBMA is a computationally efficient, alternative technique for tracing the evolution of a diffracting coherent beam. In previous papers we demonstrated the straightforward application of GBMA to the computation of the classical diffraction patterns associated with a range of standard apertures. In this paper we show how the GBMA technique can be expanded to investigate the effects of aberrations in the presence of diffraction by introducing the appropriate phase error term into the propagating quasi-optical beam. We compare our technique to the standard diffraction integral calculation for coma, astigmatism and spherical aberration, taking—for comparison—examples from the classic text 'Principles of Optics' by Born and Wolf. We show the advantages of GBMA for allowing the defocusing of an aberrated image to be evaluated quickly, which is particularly important and useful for probing the consequences of astigmatism and spherical aberration.

Spider diffraction: a comparison of curved and straight legs

International Nuclear Information System (INIS)

Richter, J.L.

1984-01-01

It has been known for some time that, if curved legs rather than the usual straight ones are used in the spider that supports the secondary optics in certain telescopes, the visible diffraction effect is reduced. Fraunhofer theory is used to calculate the diffraction effects due to the curved leg spider. Calculated and photographic diffraction patterns are compared for straight and curved leg spiders

Teaching Fraunhofer diffraction via experimental and simulated images in the laboratory

Science.gov (United States)

Peinado, Alba; Vidal, Josep; Escalera, Juan Carlos; Lizana, Angel; Campos, Juan; Yzuel, Maria

2012-10-01

Diffraction is an important phenomenon introduced to Physics university students in a subject of Fundamentals of Optics. In addition, in the Physics Degree syllabus of the Universitat Autònoma de Barcelona, there is an elective subject in Applied Optics. In this subject, diverse diffraction concepts are discussed in-depth from different points of view: theory, experiments in the laboratory and computing exercises. In this work, we have focused on the process of teaching Fraunhofer diffraction through laboratory training. Our approach involves students working in small groups. They visualize and acquire some important diffraction patterns with a CCD camera, such as those produced by a slit, a circular aperture or a grating. First, each group calibrates the CCD camera, that is to say, they obtain the relation between the distances in the diffraction plane in millimeters and in the computer screen in pixels. Afterwards, they measure the significant distances in the diffraction patterns and using the appropriate diffraction formalism, they calculate the size of the analyzed apertures. Concomitantly, students grasp the convolution theorem in the Fourier domain by analyzing the diffraction of 2-D gratings of elemental apertures. Finally, the learners use a specific software to simulate diffraction patterns of different apertures. They can control several parameters: shape, size and number of apertures, 1-D or 2-D gratings, wavelength, focal lens or pixel size.Therefore, the program allows them to reproduce the images obtained experimentally, and generate others by changingcertain parameters. This software has been created in our research group, and it is freely distributed to the students in order to help their learning of diffraction. We have observed that these hands on experiments help students to consolidate their theoretical knowledge of diffraction in a pedagogical and stimulating learning process.

Extra spots in the electron diffraction patterns of neutron irradiated zirconium and its alloys

International Nuclear Information System (INIS)

Madden, P.K.

1977-01-01

Specimens of neutron irradiated zirconium and its alloys were examined in the transmission electron microscope. Groups of extra spots, often exhibiting four-fold symmetry, were observed in thin foil electron diffraction patterns of these specimens. The 'extra-spot' structure, like the expected black-dot/small scale dislocation loop neutron irradiated damage, is approximately 100 A in size. Its nature is uncertain. It may be related to irradiation damage or to some artefact introduced during specimen preparation. If it is the latter, then published irradiation damage defect size distributions and determined irradiation growth strains of other investigators, may require modification. The present inconclusive results indicate that extra-spot structure is likely to consist of oxide particles, but may correspond to hydride precipitation or decoration effects, or even, to electron beam effects. (author)

Electron diffraction study of {alpha}-AlMnSi crystals including non-crystallographic axes

Energy Technology Data Exchange (ETDEWEB)

Song, G.L.; Bursill, L.A.

1997-06-01

The structure of crystalline {alpha}-AlMnSi is examined by electron diffraction. Six distinct zone axes are examined, including both normal crystallographic and non-crystallographic zones axes, allowing the space group symmetry to be studied. Electron diffraction patterns characteristic of Pm3-bar were obtained for thicker specimens. However, for very thin specimens, as used for HRTEM imaging, the electron diffraction patterns were characteristic of Im3-bar space group symmetry. The structural basis of the Pm3-bar to Im3-bar transformation may be understood in terms of an analysis of the icosahedral structural elements located at the corners and body-centers of the cubic unit cell. A method for indexing the non-crystallographic zone axis diffraction patterns is described. An electron diffraction pattern of the 5-fold axis of the quasicrystalline phase i-AlMnSi is also included; this is compared with the experimental results and calculations for the [0{tau}1] axis of Pm3-bar and Im3-bar crystalline phases. 26 refs., 4 tabs., 7 figs.

Correlation between the dielectric constant and X-ray diffraction pattern of Si-O-C thin films with hydrogen bonds

International Nuclear Information System (INIS)

Oh, Teresa; Oh, Kyoung Suk; Lee, Kwang-Man; Choi, Chi Kyu

2004-01-01

The amorphous structure of organic-inorganic hybrid type Si-O-C thin films was studied using the first principles molecular-dynamics method with density functional techniques. The correlation between the dielectric constant and the degree of amorphous structure in organic-inorganic hybrid type Si-O-C thin films was studied. Si-O-C thin films were deposited by high-density plasma chemical vapor deposition using bis-trimethylsilylmethane and oxygen precursors. As-deposited films and films annealed at 500 deg. C were analyzed by X-ray diffraction (XRD). For quantitative analysis, the X-ray diffraction patterns of the samples were transformed to the radial distribution function (RDF) using Fourier analysis. Hybrid type Si-O-C thin films can be divided into three types using their amorphous structure and the dielectric constant: those with organic, hybrid, and inorganic properties

Recording of X-ray diffraction patterns for the investigation of transient changes in the crystalline structure of materials subjected to the action of shock waves

International Nuclear Information System (INIS)

Jamet, F.; Thomer, G.

An arrangement including a flash X-ray tube and an image intensifier has been designed and built in order to record X-ray diffraction patterns with exposure times of the order of 100nsec. This arrangement allows Laue patterns (polychromatic radiation) as well as powder patterns (copper K(α) radiation) to be recorded. Examples for record are shown. As an application to the investigation of transient changes in crystalline structures, the Debye-Scherrer patterns of potassium chloride undergoing the dynamic action of shock waves were recorded. The first results achieved are discussed [fr

Quantitative phase analysis by neutron diffraction

Energy Technology Data Exchange (ETDEWEB)

Lee, Chang Hee; Song, Su Ho; Lee, Jin Ho; Shim, Hae Seop [Korea Atomic Energy Research Institute, Taejon (Korea)

1999-06-01

This study is to apply quantitative phase analysis (QPA) by neutron diffraction to the round robin samples provided by the International Union of Crystallography(IUCr). We measured neutron diffraction patterns for mixed samples which have several different weight percentages and their unique characteristic features. Neutron diffraction method has been known to be superior to its complementary methods such as X-ray or Synchrotron, but it is still accepted as highly reliable under limited conditions or samples. Neutron diffraction has strong capability especially on oxides due to its scattering cross-section of the oxygen and it can become a more strong tool for analysis on the industrial materials with this quantitative phase analysis techniques. By doing this study, we hope not only to do one of instrument performance tests on our HRPD but also to improve our ability on the analysis of neutron diffraction data by comparing our QPA results with others from any advanced reactor facilities. 14 refs., 4 figs., 6 tabs. (Author)

Hair treatment process providing dispersed colors by light diffraction

Science.gov (United States)

Sutton, Richard Matthew Charles; Lamartine, Bruce Carvell; Orler, E. Bruce; Song, Shuangqi

2015-12-22

A hair treatment process for providing dispersed colors by light diffraction including (a) coating the hair with a material comprising a polymer, (b) pressing the hair with a pressing device including one or more surfaces, and (c) forming a secondary nanostructured surface pattern on the hair that is complementary to the primary nanostructured surface pattern on the one or more surfaces of the pressing device. The secondary nanostructured surface pattern diffracts light into dispersed colors that are visible on the hair. The section of the hair is pressed with the pressing device for from about 1 to 55 seconds. The polymer has a glass transition temperature from about 55.degree. C. to about 90.degree. C. The one or more surfaces include a primary nanostructured surface pattern.

Structure determination of disordered organic molecules on surfaces from the Bragg spots of low-energy electron diffraction and total energy calculations

International Nuclear Information System (INIS)

Poon, H.C.; Weinert, M.; Saldin, D.K.; Stacchiola, D.; Zheng, T.; Tysoe, W.T.

2004-01-01

We show that an analysis of the intensity versus energy variation of Bragg spots due to low-energy electron diffraction from a disordered overlayer of molecules on a crystal surface allows a much more convenient method of determining the local adsorption geometries of such molecules than previously analyzed weak diffuse diffraction patterns. For the case of methanol on Pd(111), we show that the geometry determined by this means from experimental diffraction data is in excellent agreement with the predictions of density functional total energy calculations

Powder diffraction

Energy Technology Data Exchange (ETDEWEB)

Hart, M.

1995-12-31

the importance of x-ray powder diffraction as an analytical tool for phase identification of materials was first pointed out by Debye and Scherrer in Germany and, quite independently, by Hull in the US. Three distinct periods of evolution lead to ubiquitous application in many fields of science and technology. In the first period, until the mid-1940`s, applications were and developed covering broad categories of materials including inorganic materials, minerals, ceramics, metals, alloys, organic materials and polymers. During this formative period, the concept of quantitative phase analysis was demonstrated. In the second period there followed the blossoming of technology and commercial instruments became widely used. The history is well summarized by Parrish and by Langford and Loueer. By 1980 there were probably 10,000 powder diffractometers in routine use, making it the most widely used of all x-ray crystallographic instruments. In the third, present, period data bases became firmly established and sophisticated pattern fitting and recognition software made many aspects of powder diffraction analysis routine. High resolution, tunable powder diffractometers were developed at sources of synchrotron radiation. The tunability of the spectrum made it possible to exploit all the subtleties of x-ray spectroscopy in diffraction experiments.

Powder diffraction

International Nuclear Information System (INIS)

Hart, M.

1995-01-01

The importance of x-ray powder diffraction as an analytical tool for phase identification of materials was first pointed out by Debye and Scherrer in Germany and, quite independently, by Hull in the US. Three distinct periods of evolution lead to ubiquitous application in many fields of science and technology. In the first period, until the mid-1940's, applications were and developed covering broad categories of materials including inorganic materials, minerals, ceramics, metals, alloys, organic materials and polymers. During this formative period, the concept of quantitative phase analysis was demonstrated. In the second period there followed the blossoming of technology and commercial instruments became widely used. The history is well summarized by Parrish and by Langford and Loueer. By 1980 there were probably 10,000 powder diffractometers in routine use, making it the most widely used of all x-ray crystallographic instruments. In the third, present, period data bases became firmly established and sophisticated pattern fitting and recognition software made many aspects of powder diffraction analysis routine. High resolution, tunable powder diffractometers were developed at sources of synchrotron radiation. The tunability of the spectrum made it possible to exploit all the subtleties of x-ray spectroscopy in diffraction experiments

Origin of nondetectable x-ray diffraction peaks in nanocomposite CuTiZr alloys

DEFF Research Database (Denmark)

Jiang, Jianzhong; Kato, H.; Ohsuna, T.

2003-01-01

Microscopic structures of Cu60Ti10+xZr30-x (x=0 and 10) alloys have been investigated by transmission electron microscopy, x-ray diffraction (XRD) and differential scanning calorimeter (DSC). In the Cu60Ti10Zr30 samples annealed at 708 K for times ranging from 0 to 130 min, where the enthalpy...... of the first exothermic peak decreases by 80%, the corresponding XRD patterns still look similar to that for the as-prepared sample. However, the simulated XRD patterns for the pure Cu51Zr14 phase, which is the crystalline phase formed during the first exothermic reaction, with small grain sizes and defects...... clearly show a broadened amorphous-like feature. This might be the reason that no diffraction peaks from the nanocrystalline component were detected in the XRD patterns recorded for the as-cast or as-spun Cu60Ti10+xZr30-x (x=0 and 10) alloys and for the alloys annealed at lower temperatures, in which...

Fourier-Based Diffraction Analysis of Live Caenorhabditis elegans.

Science.gov (United States)

Magnes, Jenny; Hastings, Harold M; Raley-Susman, Kathleen M; Alivisatos, Clara; Warner, Adam; Hulsey-Vincent, Miranda

2017-09-13

This manuscript describes how to classify nematodes using temporal far-field diffraction signatures. A single C. elegans is suspended in a water column inside an optical cuvette. A 632 nm continuous wave HeNe laser is directed through the cuvette using front surface mirrors. A significant distance of at least 20-30 cm traveled after the light passes through the cuvette ensures a useful far-field (Fraunhofer) diffraction pattern. The diffraction pattern changes in real time as the nematode swims within the laser beam. The photodiode is placed off-center in the diffraction pattern. The voltage signal from the photodiode is observed in real time and recorded using a digital oscilloscope. This process is repeated for 139 wild type and 108 "roller" C. elegans. Wild type worms exhibit a rapid oscillation pattern in solution. The "roller" worms have a mutation in a key component of the cuticle that interferes with smooth locomotion. Time intervals that are not free of saturation and inactivity are discarded. It is practical to divide each average by its maximum to compare relative intensities. The signal for each worm is Fourier transformed so that the frequency pattern for each worm emerges. The signal for each type of worm is averaged. The averaged Fourier spectra for the wild type and the "roller" C. elegans are distinctly different and reveal that the dynamic worm shapes of the two different worm strains can be distinguished using Fourier analysis. The Fourier spectra of each worm strain match an approximate model using two different binary worm shapes that correspond to locomotory moments. The envelope of the averaged frequency distribution for actual and modeled worms confirms the model matches the data. This method can serve as a baseline for Fourier analysis for many microscopic species, as every microorganism will have its unique Fourier spectrum.

Three-dimensional Bragg diffraction in growth-disordered opals

Science.gov (United States)

Baryshev, A. V.; Kaplyanskii, Alexander A.; Kosobukin, Vladimir A.; Limonov, M. F.; Samusev, K. B.; Usvyat, D. E.

2003-06-01

After artificial opals as well as opal-based infilled and inverted composites are considered to be promising representatives of photonic crystal materials. Earlier, photonic stop gaps in opals were studied mainly in transmission or specular reflection geometries corresponding to "one-dimensional" Bragg diffraction. On the contrary, this work was aimed at observing the typical patterns of optical Bragg diffraction in which phenomenon opal crystal structure acts as a three-dimensional diffraction grating. Although our experiments were performed for artificial opals possessing unavoidable imperfections a well-pronounced diffraction peaks were observed characteristic of a crystal structure. Each of the diffraction maxima reveals a photonic stop gap in the specified direction, while the spectral width of the peak is a measure of the photonic stop gap width.

Digital diffraction analysis enables low-cost molecular diagnostics on a smartphone.

Science.gov (United States)

Im, Hyungsoon; Castro, Cesar M; Shao, Huilin; Liong, Monty; Song, Jun; Pathania, Divya; Fexon, Lioubov; Min, Changwook; Avila-Wallace, Maria; Zurkiya, Omar; Rho, Junsung; Magaoay, Brady; Tambouret, Rosemary H; Pivovarov, Misha; Weissleder, Ralph; Lee, Hakho

2015-05-05

The widespread distribution of smartphones, with their integrated sensors and communication capabilities, makes them an ideal platform for point-of-care (POC) diagnosis, especially in resource-limited settings. Molecular diagnostics, however, have been difficult to implement in smartphones. We herein report a diffraction-based approach that enables molecular and cellular diagnostics. The D3 (digital diffraction diagnosis) system uses microbeads to generate unique diffraction patterns which can be acquired by smartphones and processed by a remote server. We applied the D3 platform to screen for precancerous or cancerous cells in cervical specimens and to detect human papillomavirus (HPV) DNA. The D3 assay generated readouts within 45 min and showed excellent agreement with gold-standard pathology or HPV testing, respectively. This approach could have favorable global health applications where medical access is limited or when pathology bottlenecks challenge prompt diagnostic readouts.

Structural refinement and extraction of hydrogen atomic positions in polyoxymethylene crystal based on the first successful measurements of 2-dimensional high-energy synchrotron X-ray diffraction and wide-angle neutron diffraction patterns of hydrogenated and deuterated species

International Nuclear Information System (INIS)

Tashiro, Kohji; Hanesaka, Makoto; Ohhara, Takashi; Kurihara, Kazuo; Tamada, Taro; Kuroki, Ryota; Fujiwara, Satoru; Ozeki, Tomoji; Kitano, Toshiaki; Nishu, Takashi; Tanaka, Ichiro; Niimura, Nobuo

2007-01-01

2-Dimensional X-ray and neutron diffraction patterns have been successfully measured for deuterated and hydrogenated polyoxymethylene (POM) samples obtained by γ-ray induced solid-state polymerization reaction. More than 700 reflections were collected from the X-ray diffraction data at -150degC by utilizing a high-energy synchrotron X-ray beam at SPring-8, Japan, from which the crystal structure of POM has been refined thoroughly including the extraction of hydrogen atomic positions at clearly seen in the difference Fourier synthesis map. As the first trial the nonuniform (9/5) helical model was analyzed with the reliability factor (R factor) 6.9%. The structural analysis was made also using the X-ray reflections of about 400 observed at room temperature (R 8.8%), and the thermal parameters of constituent atoms were compared between the low and high temperatures to discuss the librational thermal motion of the chains. The 2-dimensional neutron diffraction data, collected for the deuterated and hydrogenated POM samples using an imaging plate system specifically built-up for neutron scattering experiment, have allowed us to pick up the D and H atomic positions clearly in the Fourier synthesis maps. Another possible model, (29/16) helix, which was proposed by several researches, has been also investigated on the basis of the X-ray diffraction data at -150degC. The direct method succeeded in extracting this (29/16) model straightforwardly. The R factor was 8.6%, essentially the same as that of (9/5) helical model. This means that the comparison of the diffraction intensity between the data collected from the full-rotation X-ray diffraction pattern and the intensity calculated for both the (9/5) and (29/16) models cannot be used for the unique determination of the superiority of the model, (9/5) or (29/16) helix. However, we have found the existence of 001 and 002 reflections which give the longer repeating period 55.7 A. Besides there observed a series of meridional

Pinhole diffraction holography for fabrication of high-resolution Fresnel zone plates.

Science.gov (United States)

Sarkar, Sankha S; Solak, Harun H; David, Christian; van der Veen, J Friso

2014-01-27

Fresnel zone plates (FZPs) play an essential role in high spatial resolution x-ray imaging and analysis of materials in many fields. These diffractive lenses are commonly made by serial writing techniques such as electron beam or focused ion beam lithography. Here we show that pinhole diffraction holography has potential to generate FZP patterns that are free from aberrations and imperfections that may be present in alternative fabrication techniques. In this presented method, FZPs are fabricated by recording interference pattern of a spherical wave generated by diffraction through a pinhole, illuminated with coherent plane wave at extreme ultraviolet (EUV) wavelength. Fundamental and practical issues involved in formation and recording of the interference pattern are considered. It is found that resolution of the produced FZP is directly related to the diameter of the pinhole used and the pinhole size cannot be made arbitrarily small as the transmission of EUV or x-ray light through small pinholes diminishes due to poor refractive index contrast found between materials in these spectral ranges. We also find that the practical restrictions on exposure time due to the light intensity available from current sources directly imposes a limit on the number of zones that can be printed with this method. Therefore a trade-off between the resolution and the FZP diameter exists. Overall, we find that this method can be used to fabricate aberration free FZPs down to a resolution of about 10 nm.

LEED (Low Energy Electron Diffraction)

International Nuclear Information System (INIS)

Aberdam, M.

1973-01-01

The various types of systems studied by LEED, and for which the geometry of diffraction patterns is exploited, are reviewed, intensity profiles being another source of information. Two representative approaches of the scattering phenomenon are examined; the band structure theory and the T matrix approach [fr

Quantitative multiphase analysis of archaeological bronzes by neutron diffraction

CERN Document Server

Siano, S; Celli, M; Pini, R; Salimbeni, R; Zoppi, M; Kockelmann, W A; Iozzo, M; Miccio, M; Moze, O

2002-01-01

In this paper, we report the first investigation on the potentials of neutron diffraction to characterize archaeological bronze artifacts. The preliminary feasibility of phase and structural analysis was demonstrated on standardised specimens with a typical bronze alloy composition. These were realised through different hardening and annealing cycles, simulating possible ancient working techniques. The Bragg peak widths that resulted were strictly dependent on the working treatment, thus providing an important analytical element to investigate ancient making techniques. The diagnostic criteria developed on the standardised specimens were then applied to study two Etruscan museum pieces. Quantitative multiphase analysis by Rietveld refinement of the diffraction patterns was successfully demonstrated. Furthermore, the analysis of patterns associated with different artifact elements also yielded evidence for some peculiar perspective of the neutron diffraction diagnostics in archeometric applications. (orig.)

Natural and synthetic prion structure from X-ray fiber diffraction

Energy Technology Data Exchange (ETDEWEB)

Wille, Holger; Bian, Wen; McDonald, Michele; Kendall, Amy; Colby, David W.; Bloch, Lillian; Ollesch, Julian; Borovinskiy, Alexander L.; Cohen, Fred E.; Prusiner, Stanley B.; Stubbs, Gerald; (Vanderbilt); (UCSF)

2009-10-21

A conformational isoform of the mammalian prion protein (PrP{sup Sc}) is the sole component of the infectious pathogen that causes the prion diseases. We have obtained X-ray fiber diffraction patterns from infectious prions that show cross-{beta} diffraction: meridional intensity at 4.8 {angstrom} resolution, indicating the presence of {beta} strands running approximately at right angles to the filament axis and characteristic of amyloid structure. Some of the patterns also indicated the presence of a repeating unit along the fiber axis, corresponding to four {beta}-strands. We found that recombinant (rec) PrP amyloid differs substantially from highly infectious brain-derived prions, both in structure as demonstrated by the diffraction data, and in heterogeneity as shown by electron microscopy. In addition to the strong 4.8 {angstrom} meridional reflection, the recPrP amyloid diffraction is characterized by strong equatorial intensity at approximately 10.5 {angstrom}, absent from brain-derived prions, and indicating the presence of stacked {beta}-sheets. Synthetic prions recovered from transgenic mice inoculated with recPrP amyloid displayed structural characteristics and homogeneity similar to those of naturally occurring prions. The relationship between the structural differences and prion infectivity is uncertain, but might be explained by any of several hypotheses: only a minority of recPrP amyloid possesses a replication-competent conformation, the majority of recPrP amyloid has to undergo a conformational maturation to acquire replication competency, or inhibitory forms of recPrP amyloid interfere with replication during the initial transmission.

Theoretical study of the properties of X-ray diffraction moiré fringes. I

International Nuclear Information System (INIS)

Yoshimura, Jun-ichi

2015-01-01

A detailed and comprehensive theoretical description of X-ray diffraction moiré fringes for a bicrystal specimen is given on the basis of a calculation by plane-wave dynamical diffraction theory, where the effect of the Pendellösung intensity oscillation on the moiré pattern is explained in detail. A detailed and comprehensive theoretical description of X-ray diffraction moiré fringes for a bicrystal specimen is given on the basis of a calculation by plane-wave dynamical diffraction theory. Firstly, prior to discussing the main subject of the paper, a previous article [Yoshimura (1997 ▸). Acta Cryst. A53, 810–812] on the two-dimensionality of diffraction moiré patterns is restated on a thorough calculation of the moiré interference phase. Then, the properties of moiré fringes derived from the above theory are explained for the case of a plane-wave diffraction image, where the significant effect of Pendellösung intensity oscillation on the moiré pattern when the crystal is strained is described in detail with theoretically simulated moiré images. Although such plane-wave moiré images are not widely observed in a nearly pure form, knowledge of their properties is essential for the understanding of diffraction moiré fringes in general

Diffraction gauging

International Nuclear Information System (INIS)

Wilkens, P.H.

1978-01-01

This system of gauging is now being designed to fit on an Excello NC lathe to measure the form, accuracy, and size of external contoured surfaces as they approach the finish machined size. A template profile of the finished workpiece, but 0.003 in. bigger on radius, will be aligned with the workpiece using a reference diameter and face on the machining fixture to leave a gap between the profile of the template and workpiece. A helium--neon laser beam will be projected through this gap using a rotating retroreflector and a fixed laser. The resulting diffraction pattern produced by the laser beam passing through the template to workpiece gap will be reflected and focused on a fixed diode array via a second retroreflector which moves and remains in optical alignment with the first. These retroreflectors will be rotated about a center that will enable the laser beam, which is shaped in a long slit, to scan the template workpiece gap from the pole to the equator of the workpiece. The characteristic diffraction pattern will be detected by the fixed diode array, and the signal levels from this array will be processed in a mini-computer programmed to produce a best fit through the two minima of the diode signals. The separation of the two minima will yield the size of the workpiece to template gap and this information will be presented to the machine tool operator

Adaptable Diffraction Gratings With Wavefront Transformation

Science.gov (United States)

Iazikov, Dmitri; Mossberg, Thomas W.; Greiner, Christoph M.

2010-01-01

Diffraction gratings are optical components with regular patterns of grooves, which angularly disperse incoming light by wavelength. Traditional diffraction gratings have static planar, concave, or convex surfaces. However, if they could be made so that they can change the surface curvature at will, then they would be able to focus on particular segments, self-calibrate, or perform fine adjustments. This innovation creates a diffraction grating on a deformable surface. This surface could be bent at will, resulting in a dynamic wavefront transformation. This allows for self-calibration, compensation for aberrations, enhancing image resolution in a particular area, or performing multiple scans using different wavelengths. A dynamic grating gives scientists a new ability to explore wavefronts from a variety of viewpoints.

Ultrafast electron diffraction using an ultracold source

Directory of Open Access Journals (Sweden)

M. W. van Mourik

2014-05-01

Full Text Available The study of structural dynamics of complex macromolecular crystals using electrons requires bunches of sufficient coherence and charge. We present diffraction patterns from graphite, obtained with bunches from an ultracold electron source, based on femtosecond near-threshold photoionization of a laser-cooled atomic gas. By varying the photoionization wavelength, we change the effective source temperature from 300 K to 10 K, resulting in a concomitant change in the width of the diffraction peaks, which is consistent with independently measured source parameters. This constitutes a direct measurement of the beam coherence of this ultracold source and confirms its suitability for protein crystal diffraction.

Three-dimensional x-ray diffraction detection and visualization

International Nuclear Information System (INIS)

Allahkarami, Masoud; Hanan, Jay C

2014-01-01

A new method of sensing and analyzing three-dimensional (3D) x-ray diffraction (XRD) cones was introduced. Using a two-dimensional area detector, a sequence of frames was collected while moving the detector away from the sample with small equally spaced steps and keeping all other parameters constant. A 3D dataset was created from the subsequent frames. The 3D x-ray diffraction (XRD 3 ) pattern contains far more information than a one-dimensional profile collected with the conventional diffractometer and 2D x-ray diffraction (XRD 2 ). The present work discusses some fundamentals about XRD 3 , such as the data collection method, 3D visualization, diffraction data interpretation and potential applications of XRD 3 . (paper)

Data processing software suite SITENNO for coherent X-ray diffraction imaging using the X-ray free-electron laser SACLA

International Nuclear Information System (INIS)

Sekiguchi, Yuki; Oroguchi, Tomotaka; Takayama, Yuki; Nakasako, Masayoshi

2014-01-01

The software suite SITENNO is developed for processing diffraction data collected in coherent X-ray diffraction imaging experiments of non-crystalline particles using an X-ray free-electron laser. Coherent X-ray diffraction imaging is a promising technique for visualizing the structures of non-crystalline particles with dimensions of micrometers to sub-micrometers. Recently, X-ray free-electron laser sources have enabled efficient experiments in the ‘diffraction before destruction’ scheme. Diffraction experiments have been conducted at SPring-8 Angstrom Compact free-electron LAser (SACLA) using the custom-made diffraction apparatus KOTOBUKI-1 and two multiport CCD detectors. In the experiments, ten thousands of single-shot diffraction patterns can be collected within several hours. Then, diffraction patterns with significant levels of intensity suitable for structural analysis must be found, direct-beam positions in diffraction patterns determined, diffraction patterns from the two CCD detectors merged, and phase-retrieval calculations for structural analyses performed. A software suite named SITENNO has been developed to semi-automatically apply the four-step processing to a huge number of diffraction data. Here, details of the algorithm used in the suite are described and the performance for approximately 9000 diffraction patterns collected from cuboid-shaped copper oxide particles reported. Using the SITENNO suite, it is possible to conduct experiments with data processing immediately after the data collection, and to characterize the size distribution and internal structures of the non-crystalline particles

Practical considerations in the calculation of orientation distribution functions from electron back-scattered diffraction patterns

International Nuclear Information System (INIS)

Bowen, A.W.

1994-01-01

Using model data sets for the Brass orientation, the importance of scatter width, angular accuracy and grain size and volume fraction on the sensitivity of the calculated Orientation Distribution Functions have been determined in order to highlight some of the practical considerations needed in the processing of experimental data from individual grain orientation measurements determined by the Electron Back-Scattered Diffraction technique. It is suggested that the most appropriate scatter width can be calculated from the maximum function height versus scatter width curve in order to accommodate variations in texture sharpness. The sensitivity of the ODF to careful sample preparation, mounting and pattern analysis, in order to keep errors in angular accuracy to 1 or less is demonstrated, as is the imperative need to correct for the size of grains, and their volume fractions. (orig.)

Bragg's Law diffraction simulations for electron backscatter diffraction analysis

Energy Technology Data Exchange (ETDEWEB)

Kacher, Josh, E-mail: jkacherbyu@gmail.com [Department of Mechanical Engineering, Brigham Young University, 455B Crabtree Technology Building, Provo, UT 84602 (United States); Landon, Colin; Adams, Brent L.; Fullwood, David [Department of Mechanical Engineering, Brigham Young University, 455B Crabtree Technology Building, Provo, UT 84602 (United States)

2009-08-15

In 2006, Angus Wilkinson introduced a cross-correlation-based electron backscatter diffraction (EBSD) texture analysis system capable of measuring lattice rotations and elastic strains to high resolution. A variation of the cross-correlation method is introduced using Bragg's Law-based simulated EBSD patterns as strain free reference patterns that facilitates the use of the cross-correlation method with polycrystalline materials. The lattice state is found by comparing simulated patterns to collected patterns at a number of regions on the pattern using the cross-correlation function and calculating the deformation from the measured shifts of each region. A new pattern can be simulated at the deformed state, and the process can be iterated a number of times to converge on the absolute lattice state. By analyzing an iteratively rotated single crystal silicon sample and recovering the rotation, this method is shown to have an angular resolution of {approx}0.04{sup o} and an elastic strain resolution of {approx}7e-4. As an example of applications, elastic strain and curvature measurements are used to estimate the dislocation density in a single grain of a compressed polycrystalline Mg-based AZ91 alloy.

Development of splitting convergent beam electron diffraction (SCBED)

Energy Technology Data Exchange (ETDEWEB)

Houdellier, Florent, E-mail: Florent.Houdellier@cemes.fr [CEMES-CNRS, 29 Rue Jeanne Marvig, 31055 Toulouse (France); Röder, Falk [CEMES-CNRS, 29 Rue Jeanne Marvig, 31055 Toulouse (France); Triebenberg Lab, Institut für Strukturphysik, Technische Universität Dresden, D-01062 Dresden (Germany); Snoeck, Etienne [CEMES-CNRS, 29 Rue Jeanne Marvig, 31055 Toulouse (France)

2015-12-15

Using a combination of condenser electrostatic biprism with dedicated electron optic conditions for sample illumination, we were able to split a convergent beam electron probe focused on the sample in two half focused probes without introducing any tilt between them. As a consequence, a combined convergent beam electron diffraction pattern is obtained in the back focal plane of the objective lens arising from two different sample areas, which could be analyzed in a single pattern. This splitting convergent beam electron diffraction (SCBED) pattern has been tested first on a well-characterized test sample of Si/SiGe multilayers epitaxially grown on a Si substrate. The SCBED pattern contains information from the strained area, which exhibits HOLZ lines broadening induced by surface relaxation, with fine HOLZ lines observed in the unstrained reference part of the sample. These patterns have been analyzed quantitatively using both parts of the SCBED transmitted disk. The fine HOLZ line positions are used to determine the precise acceleration voltage of the microscope while the perturbed HOLZ rocking curves in the stained area are compared to dynamical simulated ones. The combination of these two information leads to a precise evaluation of the sample strain state. Finally, several SCBED setups are proposed to tackle fundamental physics questions as well as applied materials science ones and demonstrate how SCBED has the potential to greatly expand the range of applications of electron diffraction and electron holography. - Highlights: • Using a condenser biprism, we split the CBED pattern in two half-CBED disks. • We have determined the electron optical conditions used to perform various SCBED. • We propose new applications possible for this new SCBED configuration.

DNA hydration studied by neutron fiber diffraction

Energy Technology Data Exchange (ETDEWEB)

Fuller, W.; Forsyth, V.T.; Mahendrasingam, A.; Langan, P.; Pigram, W.J. [Keele Univ. (United Kingdom)] [and others

1994-12-31

The development of neutron high angle fiber diffraction to investigate the location of water around the deoxyribonucleic acid (DNA) double-helix is described. The power of the technique is illustrated by its application to the D and A conformations of DNA using the single crystal diffractometer, D19, at the Institute Laue-Langevin, Grenoble and the time of flight diffractometer, SXD, at the Rutherford Appleton ISIS Spallation Neutron Source. These studies show the existence of bound water closely associated with the DNA. The patterns of hydration in these two DNA conformations are quite distinct and are compared to those observed in X-ray single crystal studies of two-stranded oligodeoxynucleotides. Information on the location of water around the DNA double-helix from the neutron fiber diffraction studies is combined with that on the location of alkali metal cations from complementary X-ray high angle fiber diffraction studies at the Daresbury Laboratory SRS using synchrotron radiation. These analyses emphasize the importance of viewing DNA, water and ions as a single system with specific interactions between the three components and provide a basis for understanding the effect of changes in the concentration of water and ions in inducing conformations] transitions in the DNA double-helix.

DNA hydration studied by neutron fiber diffraction

International Nuclear Information System (INIS)

Fuller, W.; Forsyth, V.T.; Mahendrasingam, A.; Langan, P.; Pigram, W.J.

1994-01-01

The development of neutron high angle fiber diffraction to investigate the location of water around the deoxyribonucleic acid (DNA) double-helix is described. The power of the technique is illustrated by its application to the D and A conformations of DNA using the single crystal diffractometer, D19, at the Institute Laue-Langevin, Grenoble and the time of flight diffractometer, SXD, at the Rutherford Appleton ISIS Spallation Neutron Source. These studies show the existence of bound water closely associated with the DNA. The patterns of hydration in these two DNA conformations are quite distinct and are compared to those observed in X-ray single crystal studies of two-stranded oligodeoxynucleotides. Information on the location of water around the DNA double-helix from the neutron fiber diffraction studies is combined with that on the location of alkali metal cations from complementary X-ray high angle fiber diffraction studies at the Daresbury Laboratory SRS using synchrotron radiation. These analyses emphasize the importance of viewing DNA, water and ions as a single system with specific interactions between the three components and provide a basis for understanding the effect of changes in the concentration of water and ions in inducing conformations] transitions in the DNA double-helix

Energy-dispersive X-ray diffraction beamline at Indus-2 synchrotron ...

Indian Academy of Sciences (India)

An energy-dispersive X-ray diffraction beamline has been designed, developed and commissioned at BL-11 bending magnet port of the Indian synchrotron source, Indus-2. The performance of this beamline has been benchmarked by measuring diffraction patterns from various elemental metals and standard inorganic ...

A Simple Diffraction Experiment Using Banana Stem as a Natural Grating

Science.gov (United States)

Aji, Mahardika Prasetya; Karunawan, Jotti; Chasanah, Widyastuti Rochimatun; Nursuhud, Puji Iman; Wiguna, Pradita Ajeng; Sulhadi

2017-01-01

A simple diffraction experiment was designed using banana stem as natural grating. Coherent beams of lasers with wavelengths of 632.8 nm and 532 nm that pass through banana stem produce periodic diffraction patterns on a screen. The diffraction experiments were able to measure the distances between the slit of the banana stem, i.e. d = (28.76 ±…

Coherent diffraction microscopy at SPring-8: instrumentation, data acquisition and data analysis

International Nuclear Information System (INIS)

Xu, Rui; Salha, Sara; Raines, Kevin S.; Jiang, Huaidong; Chen, Chien-Chun; Takahashi, Yukio; Kohmura, Yoshiki; Nishino, Yoshinori; Song, Changyong; Ishikawa, Tetsuya; Miao, Jianwei

2011-01-01

An instrumentation and data analysis review of coherent diffraction microscopy at SPring-8 is given. This work will be of interest to those who want to apply coherent diffraction imaging to studies of materials science and biological samples. Since the first demonstration of coherent diffraction microscopy in 1999, this lensless imaging technique has been experimentally refined by continued developments. Here, instrumentation and experimental procedures for measuring oversampled diffraction patterns from non-crystalline specimens using an undulator beamline (BL29XUL) at SPring-8 are presented. In addition, detailed post-experimental data analysis is provided that yields high-quality image reconstructions. As the acquisition of high-quality diffraction patterns is at least as important as the phase-retrieval procedure to guarantee successful image reconstructions, this work will be of interest for those who want to apply this imaging technique to materials science and biological samples

Submicron X-ray diffraction

International Nuclear Information System (INIS)

MacDowell, Alastair; Celestre, Richard; Tamura, Nobumichi; Spolenak, Ralph; Valek, Bryan; Brown, Walter; Bravman, John; Padmore, Howard; Batterman, Boris; Patel, Jamshed

2000-01-01

At the Advanced Light Source in Berkeley the authors have instrumented a beam line that is devoted exclusively to x-ray micro diffraction problems. By micro diffraction they mean those classes of problems in Physics and Materials Science that require x-ray beam sizes in the sub-micron range. The instrument is for instance, capable of probing a sub-micron size volume inside micron sized aluminum metal grains buried under a silicon dioxide insulating layer. The resulting Laue pattern is collected on a large area CCD detector and automatically indexed to yield the grain orientation and deviatoric (distortional) strain tensor of this sub-micron volume. A four-crystal monochromator is then inserted into the beam, which allows monochromatic light to illuminate the same part of the sample. Measurement of diffracted photon energy allows for the determination of d spacings. The combination of white and monochromatic beam measurements allow for the determination of the total strain/stress tensor (6 components) inside each sub-micron sized illuminated volume of the sample

Advancements of diffraction-based overlay metrology for double patterning

Science.gov (United States)

Li, Jie; Kritsun, Oleg; Liu, Yongdong; Dasari, Prasad; Weher, Ulrich; Volkman, Catherine; Mazur, Martin; Hu, Jiangtao

2011-03-01

As the dimensions of integrated circuit continue to shrink, diffraction based overlay (DBO) technologies have been developed to address the tighter overlay control challenges. Previously data of high accuracy and high precision were reported for litho-etch-litho-etch double patterning (DP) process using normal incidence spectroscopic reflectometry on specially designed targets composed of 1D gratings in x and y directions. Two measurement methods, empirical algorithm (eDBO) using four pads per direction (2x4 target) and modeling based algorithm (mDBO) using two pads per direction (2x2 target) were performed. In this work, we apply DBO techniques to measure overlay errors for a different DP process, litho-freeze-litho-etch process. We explore the possibility of further reducing number of pads in a DBO target using mDBO. For standard targets composed of 1D gratings, we reported results for eDBO 2x4 targets, mDBO 2x2 targets, and mDBO 2x1 target. The results of all three types of targets are comparable in terms of accuracy, dynamic precision, and TIS. TMU (not including tool matching) is less than 0.1nm. In addition, we investigated the possibility of measuring overlay with one single pad that contains 2D gratings. We achieved good correlation to blossom measurements. TMU (not including tool matching) is ~ 0.2nm. To our best knowledge, this is the first time that DBO results are reported on a single pad. eDBO allows quick recipe setup but takes more space and measurement time. Although mDBO needs details of optical properties and modeling, it offers smaller total target size and much faster throughput, which is important in high volume manufacturing environment.

New imaging technique based on diffraction of a focused x-ray beam

Energy Technology Data Exchange (ETDEWEB)

Kazimirov, A [Cornell High Energy Synchrotron Source (CHESS), Cornell University, Ithaca, NY 14853 (United States); Kohn, V G [Russian Research Center ' Kurchatov Institute, 123182 Moscow (Russian Federation); Cai, Z-H [Advanced Photon Source, 9700 S. Cass Avenue, Argonne, IL 60439 (United States)], E-mail: ayk7@cornell.edu

2009-01-07

We present first experimental results from a new diffraction depth-sensitive imaging technique. It is based on the diffraction of a focused x-ray beam from a crystalline sample and recording the intensity pattern on a high-resolution CCD detector positioned at a focal plane. Structural non-uniformity inside the sample results in a region of enhanced intensity in the diffraction pattern. The technique was applied to study silicon-on-insulator thin layers of various thicknesses which revealed a complex strain profile within the layers. A circular Fresnel zone plate was used as a focusing optic. Incoherent diffuse scattering spreads out of the diffraction plane and results in intensity recorded outside of the focal spot providing a new approach to separately register x-rays scattered coherently and incoherently from the sample. (fast track communication)

Crystal structure of the martensite phase in the ferromagnetic shape memory compound Ni2MnGa studied by electron diffraction

International Nuclear Information System (INIS)

Fukuda, Takashi; Kushida, Hiroaki; Todai, Mitsuharu; Kakeshita, Tomoyuki; Mori, Hirotaro

2009-01-01

The electron diffraction patterns of Ni 2 MnGa show six satellites at ±q M , ±2q M and ±3q M , with q M = 0.427(5) g 22 -bar 0 between fundamental reflections in the martensite phase, and two satellites at ±q I , with q I = 0.340(5) g 22 -bar 0 in the intermediate phase, meaning that these phases have incommensurate structures. In addition, the diffraction pattern of the intermediate phase continuously changes to that of the parent phase via the X-phase, suggesting the existence of a multicritical phenomenon.

Microstructural analysis in the depth direction of a heteroepitaxial AlN thick film grown on a trench-patterned template by nanobeam X-ray diffraction

Science.gov (United States)

Shida, K.; Takeuchi, S.; Tohei, T.; Miyake, H.; Hiramatsu, K.; Sumitani, K.; Imai, Y.; Kimura, S.; Sakai, A.

2018-04-01

This work quantitatively assessed the three-dimensional distribution of crystal lattice distortions in an epitaxial AlN thick film grown on a trench-patterned template, using nanobeam X-ray diffraction. Position-dependent ω-2θ-φ mapping clearly demonstrated local tilting, spacing and twisting of lattice planes as well as fluctuations in these phenomena on a sub-micrometer scale comparable to the pitch of the trench-and-terrace patterning. Analysis of the crystal lattice distortion in the depth direction was performed using a newly developed method in which the X-ray nanobeam diffracted from the sample surface to specific depths can be selectively detected by employing a Pt wire profiler. This technique generated depth-resolved ω-2θ-φ maps confirming that fluctuations in lattice plane tilting and spacing greatly depend on the dislocation distribution and the history of the AlN epitaxial growth on the trench-patterned structure. It was also found that both fluctuations were reduced on approaching the AlN surface and, in particular, were sharply reduced at specific depths in the terrace regions. These sharp reductions are attributed to the formation of sacrificial zones with degraded crystal quality around the trenches and possibly lead to raising the crystal quality near the surface of the AlN film.

Three-dimensional electron diffraction as a complementary technique to powder X-ray diffraction for phase identification and structure solution of powders

Directory of Open Access Journals (Sweden)

Yifeng Yun

2015-03-01

Full Text Available Phase identification and structure determination are important and widely used techniques in chemistry, physics and materials science. Recently, two methods for automated three-dimensional electron diffraction (ED data collection, namely automated diffraction tomography (ADT and rotation electron diffraction (RED, have been developed. Compared with X-ray diffraction (XRD and two-dimensional zonal ED, three-dimensional ED methods have many advantages in identifying phases and determining unknown structures. Almost complete three-dimensional ED data can be collected using the ADT and RED methods. Since each ED pattern is usually measured off the zone axes by three-dimensional ED methods, dynamic effects are much reduced compared with zonal ED patterns. Data collection is easy and fast, and can start at any arbitrary orientation of the crystal, which facilitates automation. Three-dimensional ED is a powerful technique for structure identification and structure solution from individual nano- or micron-sized particles, while powder X-ray diffraction (PXRD provides information from all phases present in a sample. ED suffers from dynamic scattering, while PXRD data are kinematic. Three-dimensional ED methods and PXRD are complementary and their combinations are promising for studying multiphase samples and complicated crystal structures. Here, two three-dimensional ED methods, ADT and RED, are described. Examples are given of combinations of three-dimensional ED methods and PXRD for phase identification and structure determination over a large number of different materials, from Ni–Se–O–Cl crystals, zeolites, germanates, metal–organic frameworks and organic compounds to intermetallics with modulated structures. It is shown that three-dimensional ED is now as feasible as X-ray diffraction for phase identification and structure solution, but still needs further development in order to be as accurate as X-ray diffraction. It is expected that three

Three-dimensional electron diffraction as a complementary technique to powder X-ray diffraction for phase identification and structure solution of powders.

Science.gov (United States)

Yun, Yifeng; Zou, Xiaodong; Hovmöller, Sven; Wan, Wei

2015-03-01

Phase identification and structure determination are important and widely used techniques in chemistry, physics and materials science. Recently, two methods for automated three-dimensional electron diffraction (ED) data collection, namely automated diffraction tomography (ADT) and rotation electron diffraction (RED), have been developed. Compared with X-ray diffraction (XRD) and two-dimensional zonal ED, three-dimensional ED methods have many advantages in identifying phases and determining unknown structures. Almost complete three-dimensional ED data can be collected using the ADT and RED methods. Since each ED pattern is usually measured off the zone axes by three-dimensional ED methods, dynamic effects are much reduced compared with zonal ED patterns. Data collection is easy and fast, and can start at any arbitrary orientation of the crystal, which facilitates automation. Three-dimensional ED is a powerful technique for structure identification and structure solution from individual nano- or micron-sized particles, while powder X-ray diffraction (PXRD) provides information from all phases present in a sample. ED suffers from dynamic scattering, while PXRD data are kinematic. Three-dimensional ED methods and PXRD are complementary and their combinations are promising for studying multiphase samples and complicated crystal structures. Here, two three-dimensional ED methods, ADT and RED, are described. Examples are given of combinations of three-dimensional ED methods and PXRD for phase identification and structure determination over a large number of different materials, from Ni-Se-O-Cl crystals, zeolites, germanates, metal-organic frameworks and organic compounds to intermetallics with modulated structures. It is shown that three-dimensional ED is now as feasible as X-ray diffraction for phase identification and structure solution, but still needs further development in order to be as accurate as X-ray diffraction. It is expected that three-dimensional ED methods

The magnetic structure of GdNi2B2C investigated by neutron powder diffraction

International Nuclear Information System (INIS)

Barcza, A.; Rotter, M.; Doerr, M.; Beuneu, B.

2005-01-01

Full text: The group of ReT 2 B 2 C (Re=rare earth, T=transition metal) shows a very interesting interplay between magnetism and superconductivity due to the rare earth metals. In this work the magnetism of GdNi 2 B 2 C was studied with neutron diffraction. Previous investigations with x-ray diffraction methods have determined the crystal structure as a body centered tetragonal structure (I 4/mmm). Hot neutrons were used for the diffraction experiment, because the absorption cross section of Gd is significantly smaller for short wavelengths. The investigated compound orders magnetically at TN=19.5 K, and so the experiment was carried out at two temperatures, namely 30 K and 2.2 K. The results show a incommensurate spin structure with a propagation vector of (0.55 0 0). To confirm this results additional simulations of the spin structure were done based on the Standard Model of rare earth magnetism. A neutron diffraction pattern was calculated using the McPhase program package and is compared to the experimental data. (author)

Analysis of synchrotron X-ray diffraction patterns from fluorotic enamel samples

Energy Technology Data Exchange (ETDEWEB)

Almeida, Ana P.G.; Braz, Delson, E-mail: anapaulagalmeida@gmail.co [Coordenacao dos Programas de Pos-graduacao de Engenharia (COPPE/UFRJ), Rio de Janeiro, RJ (Brazil). Lab. de Instrumentacao Nuclear; Colaco, Marcos V.; Barroso, Regina C., E-mail: cely@uerj.b [Universidade do Estado do Rio de Janeiro (UERJ), RJ (Brazil). Inst. de Fisica; Porto, Isabel M., E-mail: belporto@ig.com.b [Universidade Estadual de Campinas (UNICAMP), Piracicaba, SP (Brazil). Faculdade de Odontologia; Gerlach, Raquel F., E-mail: rfgerlach@forp.usp.b [Universidade de Sao Paulo (USP), Ribeirao Preto, SP (Brazil). Faculdade de Odontologia; Droppa Junior, Roosevelt, E-mail: rdroppa@lnls.b [Associacao Brasileira de Tecnologia de Luz Sincrotron (ABTLuS), Campinas, SP (Brazil)

2009-07-01

With the introduction of fluoride as the main anticaries agent used in preventive dentistry, and perhaps an increase in fluoride in our food chain, dental fluorosis has become an increasing world-wide problem. Visible signs of fluorosis begin to become obvious on the enamel surface as opacities, implying some porosity in the tissue. The mechanisms that conduct the formation of fluorotic enamel are unknown, but should involve modifications in the basics physical-chemistry reactions of demineralisation and remineralisation of the enamel of the teeth, which is the same reaction of formation of the enamel's hydroxyapatite (HAp) in the maturation phase. The increase of the amount of fluoride inside of the apatite will result in gradual increase of the lattice parameters. The hexagonal symmetry seems to work well with the powder diffraction data, and the crystal structure of HAp is usually described in space group P63/m. The aim of this work is to characterize the healthy and fluorotic enamel in human tooth using technique Synchrotron X-ray diffraction in order to determine the crystal structure and crystallinity of on fluoroapatite (FAp) crystal present in fluoritic enamel. All the scattering profile measurements was carried out at the X-ray diffraction beamline (XRD1) at the National Synchrotron Light Laboratory - LNLS, Campinas, Brazil. (author)

Analysis of synchrotron X-ray diffraction patterns from fluorotic enamel samples

International Nuclear Information System (INIS)

Almeida, Ana P.G.; Braz, Delson

2009-01-01

With the introduction of fluoride as the main anticaries agent used in preventive dentistry, and perhaps an increase in fluoride in our food chain, dental fluorosis has become an increasing world-wide problem. Visible signs of fluorosis begin to become obvious on the enamel surface as opacities, implying some porosity in the tissue. The mechanisms that conduct the formation of fluorotic enamel are unknown, but should involve modifications in the basics physical-chemistry reactions of demineralisation and remineralisation of the enamel of the teeth, which is the same reaction of formation of the enamel's hydroxyapatite (HAp) in the maturation phase. The increase of the amount of fluoride inside of the apatite will result in gradual increase of the lattice parameters. The hexagonal symmetry seems to work well with the powder diffraction data, and the crystal structure of HAp is usually described in space group P63/m. The aim of this work is to characterize the healthy and fluorotic enamel in human tooth using technique Synchrotron X-ray diffraction in order to determine the crystal structure and crystallinity of on fluoroapatite (FAp) crystal present in fluoritic enamel. All the scattering profile measurements was carried out at the X-ray diffraction beamline (XRD1) at the National Synchrotron Light Laboratory - LNLS, Campinas, Brazil. (author)

Simulations of X-ray diffraction of shock-compressed single-crystal tantalum with synchrotron undulator sources.

Science.gov (United States)

Tang, M X; Zhang, Y Y; E, J C; Luo, S N

2018-05-01

Polychromatic synchrotron undulator X-ray sources are useful for ultrafast single-crystal diffraction under shock compression. Here, simulations of X-ray diffraction of shock-compressed single-crystal tantalum with realistic undulator sources are reported, based on large-scale molecular dynamics simulations. Purely elastic deformation, elastic-plastic two-wave structure, and severe plastic deformation under different impact velocities are explored, as well as an edge release case. Transmission-mode diffraction simulations consider crystallographic orientation, loading direction, incident beam direction, X-ray spectrum bandwidth and realistic detector size. Diffraction patterns and reciprocal space nodes are obtained from atomic configurations for different loading (elastic and plastic) and detection conditions, and interpretation of the diffraction patterns is discussed.

Simulations of X-ray diffraction of shock-compressed single-crystal tantalum with synchrotron undulator sources

Energy Technology Data Exchange (ETDEWEB)

Tang, M. X.; Zhang, Y. Y.; E, J. C.; Luo, S. N.

2018-04-24

Polychromatic synchrotron undulator X-ray sources are useful for ultrafast single-crystal diffraction under shock compression. Here, simulations of X-ray diffraction of shock-compressed single-crystal tantalum with realistic undulator sources are reported, based on large-scale molecular dynamics simulations. Purely elastic deformation, elastic–plastic two-wave structure, and severe plastic deformation under different impact velocities are explored, as well as an edge release case. Transmission-mode diffraction simulations consider crystallographic orientation, loading direction, incident beam direction, X-ray spectrum bandwidth and realistic detector size. Diffraction patterns and reciprocal space nodes are obtained from atomic configurations for different loading (elastic and plastic) and detection conditions, and interpretation of the diffraction patterns is discussed.

Dynamical neutron diffraction by curved crystals in the Laue geometry

International Nuclear Information System (INIS)

Albertini, G.; Melone, S.; Lagomarsino, S.; Mazkedian, S.; Puliti, P.; Rustichelli, F.

1977-01-01

The Taupin dynamical theory of X-ray diffraction by deformed crystals which was previously extended to the neutron diffraction by curved crystals in the Bragg geometry, is applied to calculate neutron diffraction patterns in the Laue geometry. The theoretical results are compared with experimental data on curved silicon crystals. The agreement is quite satisfactory. In the second part a simple model recently presented to describe neutron diffraction properties in the Bragg case is extended to the Laue case. The predictions of such a model are in satisfactory agreement with the rigorous theory and the experimental results. (author)

Diffraction. Powder, amorphous, liquid

International Nuclear Information System (INIS)

Sosnowska, I.M.

1999-01-01

Neutron powder diffraction is a unique tool to observe all possible diffraction effects appearing in crystal. High-resolution neutron diffractometers have to be used in this study. Analysis of the magnetic structure of polycrystalline materials requires the use of high-resolution neutron diffraction in the range of large interplanar distances. As distinguished from the double axis diffractometers (DAS), which show high resolution only at small interplanar distances, TOF (time-of-flight) diffractometry offers the best resolution at large interplanar distances. (K.A.)

Diffractive scattering

CERN Document Server

De Wolf, E.A.

2002-01-01

We discuss basic concepts and properties of diffractive phenomena in soft hadron collisions and in deep-inelastic scattering at low Bjorken-x. The paper is not a review of the rapidly developing field but presents an attempt to show in simple terms the close inter-relationship between the dynamics of high-energy hadronic and deep-inelastic diffraction. Using the saturation model of Golec-Biernat and Wusthoff as an example, a simple explanation of geometrical scaling is presented. The relation between the QCD anomalous multiplicity dimension and the Pomeron intercept is discussed.

Diffractive Scattering

International Nuclear Information System (INIS)

Wolf, E.A. de

2002-01-01

We discuss basic concepts and properties of diffractive phenomena in soft hadron collisions and in deep-inelastic scattering at low Bjorken - x. The paper is not a review of the rapidly developing field but presents an attempt to show in simple terms the close inter-relationship between the dynamics of high-energy hadronic and deep-inelastic diffraction. Using the saturation model of Golec-Biernat and Wuesthoff as an example, a simple explanation of geometrical scaling is presented. The relation between the QCD anomalous multiplicity dimension and the Pomeron intercept is discussed. (author)

Relativistic electron diffraction at the UCLA Pegasus photoinjector laboratory

Energy Technology Data Exchange (ETDEWEB)

Musumeci, P. [UCLA Department of Physics and Astronomy, 475 Portola Plaza, Los Angeles, CA 90095-1547 (United States)], E-mail: musumeci@physics.ucla.edu; Moody, J.T.; Scoby, C.M. [UCLA Department of Physics and Astronomy, 475 Portola Plaza, Los Angeles, CA 90095-1547 (United States)

2008-10-15

Electron diffraction holds the promise to yield real-time resolution of atomic motion in an easily accessible environment like a university laboratory at a fraction of the cost of fourth-generation X-ray sources. Currently the limit in time-resolution for conventional electron diffraction is set by how short an electron pulse can be made. A very promising solution to maintain the highest possible beam intensity without excessive pulse broadening from space charge effects is to increase the electron energy to the MeV level where relativistic effects significantly reduce the space charge forces. Rf photoinjectors can in principle deliver up to 10{sup 7}-10{sup 8} electrons packed in bunches of {approx}100-fs length, allowing an unprecedented time resolution and enabling the study of irreversible phenomena by single-shot diffraction patterns. The use of rf photoinjectors as sources for ultrafast electron diffraction has been recently at the center of various theoretical and experimental studies. The UCLA Pegasus laboratory, commissioned in early 2007 as an advanced photoinjector facility, is the only operating system in the country, which has recently demonstrated electron diffraction using a relativistic beam from an rf photoinjector. Due to the use of a state-of-the-art ultrashort photoinjector driver laser system, the beam has been measured to be sub-100-fs long, at least a factor of 5 better than what measured in previous relativistic electron diffraction setups. Moreover, diffraction patterns from various metal targets (titanium and aluminum) have been obtained using the Pegasus beam. One of the main laboratory goals in the near future is to fully develop the rf photoinjector-based ultrafast electron diffraction technique with particular attention to the optimization of the working point of the photoinjector in a low-charge ultrashort pulse regime, and to the development of suitable beam diagnostics.

Relativistic electron diffraction at the UCLA Pegasus photoinjector laboratory

International Nuclear Information System (INIS)

Musumeci, P.; Moody, J.T.; Scoby, C.M.

2008-01-01

Electron diffraction holds the promise to yield real-time resolution of atomic motion in an easily accessible environment like a university laboratory at a fraction of the cost of fourth-generation X-ray sources. Currently the limit in time-resolution for conventional electron diffraction is set by how short an electron pulse can be made. A very promising solution to maintain the highest possible beam intensity without excessive pulse broadening from space charge effects is to increase the electron energy to the MeV level where relativistic effects significantly reduce the space charge forces. Rf photoinjectors can in principle deliver up to 10 7 -10 8 electrons packed in bunches of ∼100-fs length, allowing an unprecedented time resolution and enabling the study of irreversible phenomena by single-shot diffraction patterns. The use of rf photoinjectors as sources for ultrafast electron diffraction has been recently at the center of various theoretical and experimental studies. The UCLA Pegasus laboratory, commissioned in early 2007 as an advanced photoinjector facility, is the only operating system in the country, which has recently demonstrated electron diffraction using a relativistic beam from an rf photoinjector. Due to the use of a state-of-the-art ultrashort photoinjector driver laser system, the beam has been measured to be sub-100-fs long, at least a factor of 5 better than what measured in previous relativistic electron diffraction setups. Moreover, diffraction patterns from various metal targets (titanium and aluminum) have been obtained using the Pegasus beam. One of the main laboratory goals in the near future is to fully develop the rf photoinjector-based ultrafast electron diffraction technique with particular attention to the optimization of the working point of the photoinjector in a low-charge ultrashort pulse regime, and to the development of suitable beam diagnostics

Relativistic electron diffraction at the UCLA Pegasus photoinjector laboratory.

Science.gov (United States)

Musumeci, P; Moody, J T; Scoby, C M

2008-10-01

Electron diffraction holds the promise to yield real-time resolution of atomic motion in an easily accessible environment like a university laboratory at a fraction of the cost of fourth-generation X-ray sources. Currently the limit in time-resolution for conventional electron diffraction is set by how short an electron pulse can be made. A very promising solution to maintain the highest possible beam intensity without excessive pulse broadening from space charge effects is to increase the electron energy to the MeV level where relativistic effects significantly reduce the space charge forces. Rf photoinjectors can in principle deliver up to 10(7)-10(8) electrons packed in bunches of approximately 100-fs length, allowing an unprecedented time resolution and enabling the study of irreversible phenomena by single-shot diffraction patterns. The use of rf photoinjectors as sources for ultrafast electron diffraction has been recently at the center of various theoretical and experimental studies. The UCLA Pegasus laboratory, commissioned in early 2007 as an advanced photoinjector facility, is the only operating system in the country, which has recently demonstrated electron diffraction using a relativistic beam from an rf photoinjector. Due to the use of a state-of-the-art ultrashort photoinjector driver laser system, the beam has been measured to be sub-100-fs long, at least a factor of 5 better than what measured in previous relativistic electron diffraction setups. Moreover, diffraction patterns from various metal targets (titanium and aluminum) have been obtained using the Pegasus beam. One of the main laboratory goals in the near future is to fully develop the rf photoinjector-based ultrafast electron diffraction technique with particular attention to the optimization of the working point of the photoinjector in a low-charge ultrashort pulse regime, and to the development of suitable beam diagnostics.

Single photon energy dispersive x-ray diffraction

International Nuclear Information System (INIS)

Higginbotham, Andrew; Patel, Shamim; Ciricosta, Orlando; Suggit, Matthew J.; Wark, Justin S.; Hawreliak, James A.; Collins, Gilbert W.; Coppari, Federica; Eggert, Jon H.; Tang, Henry

2014-01-01

With the pressure range accessible to laser driven compression experiments on solid material rising rapidly, new challenges in the diagnosis of samples in harsh laser environments are emerging. When driving to TPa pressures (conditions highly relevant to planetary interiors), traditional x-ray diffraction techniques are plagued by increased sources of background and noise, as well as a potential reduction in signal. In this paper we present a new diffraction diagnostic designed to record x-ray diffraction in low signal-to-noise environments. By utilising single photon counting techniques we demonstrate the ability to record diffraction patterns on nanosecond timescales, and subsequently separate, photon-by-photon, signal from background. In doing this, we mitigate many of the issues surrounding the use of high intensity lasers to drive samples to extremes of pressure, allowing for structural information to be obtained in a regime which is currently largely unexplored

Single photon energy dispersive x-ray diffraction

Energy Technology Data Exchange (ETDEWEB)

Higginbotham, Andrew; Patel, Shamim; Ciricosta, Orlando; Suggit, Matthew J.; Wark, Justin S. [Department of Physics, Clarendon Laboratory, University of Oxford, Parks Road, Oxford OX1 3PU (United Kingdom); Hawreliak, James A.; Collins, Gilbert W.; Coppari, Federica; Eggert, Jon H. [Lawrence Livermore National Laboratory, Livermore, California 94551 (United States); Tang, Henry [Department of Earth and Planetary Science, University of California Berkeley, Berkeley, California 94720 (United States)

2014-03-15

With the pressure range accessible to laser driven compression experiments on solid material rising rapidly, new challenges in the diagnosis of samples in harsh laser environments are emerging. When driving to TPa pressures (conditions highly relevant to planetary interiors), traditional x-ray diffraction techniques are plagued by increased sources of background and noise, as well as a potential reduction in signal. In this paper we present a new diffraction diagnostic designed to record x-ray diffraction in low signal-to-noise environments. By utilising single photon counting techniques we demonstrate the ability to record diffraction patterns on nanosecond timescales, and subsequently separate, photon-by-photon, signal from background. In doing this, we mitigate many of the issues surrounding the use of high intensity lasers to drive samples to extremes of pressure, allowing for structural information to be obtained in a regime which is currently largely unexplored.

Neutron magnetic multiple diffraction in a natural magnetite crystal

International Nuclear Information System (INIS)

Mazzocchi, V.L.; Parente, C.B.R.

1988-09-01

Neutron multiple diffraction has been employed in the study of the magnetism in magnetite (Fe 3 O 4 ). Magnetite has a crystallographic structure of an inverted spinel with tetrahedral A sites occupied solely by trivalent Fe 3+ ions and octahedral B sites occupied both by divalent Fe 2+ ions and the remaining Fe 3+ ions in random distribution. At room temperature magnetite is a Neel A-B ferrimagnet where the ions on the A, B sites are coupled antiferromagneticaly. This coupling disappears at T sup c approx. or approx.= 580 0 C. Employing a natural single crystal of magnetite experimental neutron multiple diffraction patterns were obtained for the primary reflection 111 at room temperature and 703 0 C. This reflection is almost entirely magnetic in origin resulting in 'Aufhellung' patterns below T c and mixed 'Aufhellung-Umweganregung' patterns above T c . Theoretical patterns were calculated employing the iterative method for the approximation of intensities by a Taylor series and compared to the experimental results. (author) [pt

Study on mineral components of rat calvaria by means of X-ray powder diffraction analysis and Raman microprobe spectroscopy

Energy Technology Data Exchange (ETDEWEB)

Tamura, Norihiro [Meikai Univ., Sakado, Saitama (Japan). School of Dentistry

2000-07-01

the same diffraction pattern, and OCP samples showed a weak diffraction pattern similar to that of a mixture consisting of {beta}-TCP as the major part and {beta}-CPP in trace amount. Raman microprobe spectrometry was performed on the rat calvaria and synthetic samples before and after plasma ashing. The results showed that plasma ashing pretreatment had no effect on the HA, {beta}-CPP and {beta}-TCP samples, similar to the results obtained by X-ray diffraction. However, plasma ashing gave rise to 965 cm{sup -1}, 1010 cm{sup -1} and 1035{sup -1} peaks in the OCP samples. Further, DCPD and {beta}-CPP displayed a similar pattern of peaks. On the other hand, spectral patterns of samples from both embryonal and newborn rats were shown to be similar to those of OCP samples. A 960 cm{sup -1} peak was revealed in the spectrum of 6-day-old calvaria, which was similar to that of HA. Furthermore, 960 cm{sup -1} and 1044 cm{sup -1} peaks were observed in the 12-week-old specimens, which are characteristic to HA and strongly suggests the existence of HA. In this study, it is clearly demonstrated that OCP occurred as a precursor of HA during the process of HA development in the rat calvaria. (author)

Study on mineral components of rat calvaria by means of X-ray powder diffraction analysis and Raman microprobe spectroscopy

International Nuclear Information System (INIS)

Tamura, Norihiro

2000-01-01

samples showed a weak diffraction pattern similar to that of a mixture consisting of β-TCP as the major part and β-CPP in trace amount. Raman microprobe spectrometry was performed on the rat calvaria and synthetic samples before and after plasma ashing. The results showed that plasma ashing pretreatment had no effect on the HA, β-CPP and β-TCP samples, similar to the results obtained by X-ray diffraction. However, plasma ashing gave rise to 965 cm -1 , 1010 cm -1 and 1035 -1 peaks in the OCP samples. Further, DCPD and β-CPP displayed a similar pattern of peaks. On the other hand, spectral patterns of samples from both embryonal and newborn rats were shown to be similar to those of OCP samples. A 960 cm -1 peak was revealed in the spectrum of 6-day-old calvaria, which was similar to that of HA. Furthermore, 960 cm -1 and 1044 cm -1 peaks were observed in the 12-week-old specimens, which are characteristic to HA and strongly suggests the existence of HA. In this study, it is clearly demonstrated that OCP occurred as a precursor of HA during the process of HA development in the rat calvaria. (author)

Understanding deformation with high angular resolution electron backscatter diffraction (HR-EBSD)

Science.gov (United States)

Britton, T. B.; Hickey, J. L. R.

2018-01-01

High angular resolution electron backscatter diffraction (HR-EBSD) affords an increase in angular resolution, as compared to ‘conventional’ Hough transform based EBSD, of two orders of magnitude, enabling measurements of relative misorientations of 1 x 10-4 rads (~ 0.006°) and changes in (deviatoric) lattice strain with a precision of 1 x 10-4. This is achieved through direct comparison of two or more diffraction patterns using sophisticated cross-correlation based image analysis routines. Image shifts between zone axes in the two-correlated diffraction pattern are measured with sub-pixel precision and this realises the ability to measure changes in interplanar angles and lattice orientation with a high degree of sensitivity. These shifts are linked to strains and lattice rotations through simple geometry. In this manuscript, we outline the basis of the technique and two case studies that highlight its potential to tackle real materials science challenges, such as deformation patterning in polycrystalline alloys.

Time-resolved Neutron Powder Diffraction

International Nuclear Information System (INIS)

Pannetier, J.

1986-01-01

The use of a high-flux neutron source together with a large position sensitive detector (PSD) allows a powder diffraction pattern to be recorded at a time-scale of a few minutes so that crystalline systems under non-equilibrium conditions may now conveniently be investigated. This introduces a new dimension into powder diffraction (the time and transient phenomena like heterogeneous chemical reactions can now be easily studied. The instrumental parameters relevant for the design of such time-dependent experiments are briefly surveyed and the current limits of the method are discussed. The applications are illustrated by two kinds of experiment in the field of inorganic solid state chemistry: true kinetic studies of heterogeneous chemical reactions and thermodiffractometry experiments

The diffractive achromat full spectrum computational imaging with diffractive optics

KAUST Repository

Peng, Yifan

2016-07-11

Diffractive optical elements (DOEs) have recently drawn great attention in computational imaging because they can drastically reduce the size and weight of imaging devices compared to their refractive counterparts. However, the inherent strong dispersion is a tremendous obstacle that limits the use of DOEs in full spectrum imaging, causing unacceptable loss of color fidelity in the images. In particular, metamerism introduces a data dependency in the image blur, which has been neglected in computational imaging methods so far. We introduce both a diffractive achromat based on computational optimization, as well as a corresponding algorithm for correction of residual aberrations. Using this approach, we demonstrate high fidelity color diffractive-only imaging over the full visible spectrum. In the optical design, the height profile of a diffractive lens is optimized to balance the focusing contributions of different wavelengths for a specific focal length. The spectral point spread functions (PSFs) become nearly identical to each other, creating approximately spectrally invariant blur kernels. This property guarantees good color preservation in the captured image and facilitates the correction of residual aberrations in our fast two-step deconvolution without additional color priors. We demonstrate our design of diffractive achromat on a 0.5mm ultrathin substrate by photolithography techniques. Experimental results show that our achromatic diffractive lens produces high color fidelity and better image quality in the full visible spectrum. © 2016 ACM.

Light Diffraction by Large Amplitude Ultrasonic Waves in Liquids

Science.gov (United States)

Adler, Laszlo; Cantrell, John H.; Yost, William T.

2016-01-01

Light diffraction from ultrasound, which can be used to investigate nonlinear acoustic phenomena in liquids, is reported for wave amplitudes larger than that typically reported in the literature. Large amplitude waves result in waveform distortion due to the nonlinearity of the medium that generates harmonics and produces asymmetries in the light diffraction pattern. For standing waves with amplitudes above a threshold value, subharmonics are generated in addition to the harmonics and produce additional diffraction orders of the incident light. With increasing drive amplitude above the threshold a cascade of period-doubling subharmonics are generated, terminating in a region characterized by a random, incoherent (chaotic) diffraction pattern. To explain the experimental results a toy model is introduced, which is derived from traveling wave solutions of the nonlinear wave equation corresponding to the fundamental and second harmonic standing waves. The toy model reduces the nonlinear partial differential equation to a mathematically more tractable nonlinear ordinary differential equation. The model predicts the experimentally observed cascade of period-doubling subharmonics terminating in chaos that occurs with increasing drive amplitudes above the threshold value. The calculated threshold amplitude is consistent with the value estimated from the experimental data.

Experimental technique of stress analyses by neutron diffraction

International Nuclear Information System (INIS)

Sun, Guangai; Chen, Bo; Huang, Chaoqiang

2009-09-01

The structures and main components of neutron diffraction stress analyses spectrometer, SALSA, as well as functions and parameters of each components are presented. The technical characteristic and structure parameters of SALSA are described. Based on these aspects, the choice of gauge volume, method of positioning sample, determination of diffraction plane and measurement of zero stress do are discussed. Combined with the practical experiments, the basic experimental measurement and the related settings are introduced, including the adjustments of components, pattern scattering, data recording and checking etc. The above can be an instruction for stress analyses experiments by neutron diffraction and neutron stress spectrometer construction. (authors)

Energy-weighted dynamical scattering simulations of electron diffraction modalities in the scanning electron microscope.

Science.gov (United States)

Pascal, Elena; Singh, Saransh; Callahan, Patrick G; Hourahine, Ben; Trager-Cowan, Carol; Graef, Marc De

2018-04-01

Transmission Kikuchi diffraction (TKD) has been gaining momentum as a high resolution alternative to electron back-scattered diffraction (EBSD), adding to the existing electron diffraction modalities in the scanning electron microscope (SEM). The image simulation of any of these measurement techniques requires an energy dependent diffraction model for which, in turn, knowledge of electron energies and diffraction distances distributions is required. We identify the sample-detector geometry and the effect of inelastic events on the diffracting electron beam as the important factors to be considered when predicting these distributions. However, tractable models taking into account inelastic scattering explicitly are lacking. In this study, we expand the Monte Carlo (MC) energy-weighting dynamical simulations models used for EBSD [1] and ECP [2] to the TKD case. We show that the foil thickness in TKD can be used as a means of energy filtering and compare band sharpness in the different modalities. The current model is shown to correctly predict TKD patterns and, through the dictionary indexing approach, to produce higher quality indexed TKD maps than conventional Hough transform approach, especially close to grain boundaries. Copyright © 2018 The Authors. Published by Elsevier B.V. All rights reserved.

Axial channeling in electron diffraction

International Nuclear Information System (INIS)

Ichimiya, A.; Lehmpfuhl, G.

1978-01-01

Kossel patterns from Silicon and Niobium were obtained with a convergent electron beam. An intensity maximum in the direction of the zone axes [001] and [111] of Nb was interpreted as axial channeling. The intensity distribution in Kossel patterns was calculated by means of the Bloch wave picture of the dynamical theory of electron diffraction. Particularly zone axis patterns were calculated for different substance-energy combinations and they were compared with experimental observations. The intensity distribution in the calculated Kossel patterns was very sensitive to the model of absorption and it was found that a treatment of the absorption close to the model of Humphreys and Hirsch [Phil. Mag. 18, 115 (1968)] gave the best agreement with the experimental observations. Furthermore it is shown which Bloch waves are important for the intensity distribution in the Kossel patterns, how they are absorbed and how they change with energy. (orig.) [de

Nanostructure Diffraction Gratings for Integrated Spectroscopy and Sensing

Science.gov (United States)

Guo, Junpeng (Inventor)

2016-01-01

The present disclosure pertains to metal or dielectric nanostructures of the subwavelength scale within the grating lines of optical diffraction gratings. The nanostructures have surface plasmon resonances or non-plasmon optical resonances. A linear photodetector array is used to capture the resonance spectra from one of the diffraction orders. The combined nanostructure super-grating and photodetector array eliminates the use of external optical spectrometers for measuring surface plasmon or optical resonance frequency shift caused by the presence of chemical and biological agents. The nanostructure super-gratings can be used for building integrated surface enhanced Raman scattering (SERS) spectrometers. The nanostructures within the diffraction grating lines enhance Raman scattering signal light while the diffraction grating pattern of the nanostructures diffracts Raman scattering light to different directions of propagation according to their wavelengths. Therefore, the nanostructure super-gratings allows for the use of a photodetector array to capture the surface enhanced Raman scattering spectra.

Photonic crystal and photonic quasicrystal patterned in PDMS surfaces and their effect on LED radiation properties

Energy Technology Data Exchange (ETDEWEB)

Suslik, Lubos [Dept. of Physics, Faculty of Electrical Engineering, University of Zilina, Univerzitna 1, 010 26, Zilina (Slovakia); Pudis, Dusan, E-mail: pudis@fyzika.uniza.sk [Dept. of Physics, Faculty of Electrical Engineering, University of Zilina, Univerzitna 1, 010 26, Zilina (Slovakia); Goraus, Matej [Dept. of Physics, Faculty of Electrical Engineering, University of Zilina, Univerzitna 1, 010 26, Zilina (Slovakia); Nolte, Rainer [Fakultät für Maschinenbau FG Lichttechnik Ilmenau University of Technology, Ilmenau (Germany); Kovac, Jaroslav [Inst. of Electronics and Photonics, Slovak University of Technology, Ilkovicova 3, 812 19, Bratislava (Slovakia); Durisova, Jana; Gaso, Peter [Dept. of Physics, Faculty of Electrical Engineering, University of Zilina, Univerzitna 1, 010 26, Zilina (Slovakia); Hronec, Pavol [Inst. of Electronics and Photonics, Slovak University of Technology, Ilkovicova 3, 812 19, Bratislava (Slovakia); Schaaf, Peter [Chair Materials for Electronics, Institute of Materials Engineering and Institute of Micro- and Nanotechnologies MacroNano, TU Ilmenau, Gustav-Kirchhoff-Str. 5, 98693 Ilmenau (Germany)

2017-02-15

Graphical abstract: Photonic quasicrystal patterned in the surface of polydimethylsiloxane membrane (left) and radiation pattern of light emitting diode with patterned membrane applied in the surface (right). - Highlights: • We presented fabrication technique of PDMS membranes with patterned surface by photonic crystal (PhC) and photonic quasi-crystal (PQC). • Presented technique is effective for preparation PhC and PQC PDMS membranes easily implementing in the LED chip. • From the goniophotometer measurements, the membranes document effective angular emission due to the diffraction on patterned surfaces. • 12 fold symmetry PQC structure shows homogeneous radiation pattern, while the 2 fold symmetry of square PhC shows evident diffraction lobes. - Abstract: We present results of fabrication and implementation of thin polydimethylsiloxane (PDMS) membranes with patterned surface for the light emitting diode (LED). PDMS membranes were patterned by using the interference lithography in combination with embossing technique. Two-dimensional photonic crystal and photonic quasicrystal structures with different period were patterned in the surface of thin PDMS membranes with depth up to 550 nm. Patterned PDMS membranes placed on the LED chip effectively diffracted light and increased angular emission of LED radiation pattern. We presented effective technique for fabrication of patterned PDMS membranes, which could modify the emission properties of optoelectronic devices and can be applied directly on surface LEDs and small optical devices.

Characterization of breast tissue using energy-dispersive X-ray diffraction computed tomography

International Nuclear Information System (INIS)

Pani, S.; Cook, E.J.; Horrocks, J.A.; Jones, J.L.; Speller, R.D.

2010-01-01

A method for sample characterization using energy-dispersive X-ray diffraction computed tomography (EDXRDCT) is presented. The procedures for extracting diffraction patterns from the data and the corrections applied are discussed. The procedures were applied to the characterization of breast tissue samples, 6 mm in diameter. Comparison with histological sections of the samples confirmed the possibility of grouping the patterns into five families, corresponding to adipose tissue, fibrosis, poorly differentiated cancer, well differentiated cancer and benign tumour.

Prospect for application of compact accelerator-based neutron source to neutron engineering diffraction

Energy Technology Data Exchange (ETDEWEB)

Ikeda, Yoshimasa, E-mail: yoshimasa.ikeda@riken.jp [Center for Advanced Photonics, RIKEN, Wako, Saitama 351-0198 (Japan); Taketani, Atsushi; Takamura, Masato; Sunaga, Hideyuki [Center for Advanced Photonics, RIKEN, Wako, Saitama 351-0198 (Japan); Kumagai, Masayoshi [Faculty of Engineering, Tokyo City University, Setagaya, Tokyo 158-8857 (Japan); Oba, Yojiro [Research Reactor Institute, Kyoto University, Kumatori, Osaka 590-0494 (Japan); Otake, Yoshie [Center for Advanced Photonics, RIKEN, Wako, Saitama 351-0198 (Japan); Suzuki, Hiroshi [Materials Sciences Research Center, Japan Atomic Energy Agency, Tokai, Ibaraki 319-1195 (Japan)

2016-10-11

A compact accelerator-based neutron source has been lately discussed on engineering applications such as transmission imaging and small angle scattering as well as reflectometry. However, nobody considers using it for neutron diffraction experiment because of its low neutron flux. In this study, therefore, the neutron diffraction experiments are carried out using Riken Accelerator-driven Compact Neutron Source (RANS), to clarify the capability of the compact neutron source for neutron engineering diffraction. The diffraction pattern from a ferritic steel was successfully measured by suitable arrangement of the optical system to reduce the background noise, and it was confirmed that the recognizable diffraction pattern can be measured by a large sampling volume with 10 mm in cubic for an acceptable measurement time, i.e. 10 min. The minimum resolution of the 110 reflection for RANS is approximately 2.5% at 8 μs of the proton pulse width, which is insufficient to perform the strain measurement by neutron diffraction. The moderation time width at the wavelength corresponding to the 110 reflection is estimated to be approximately 30 μs, which is the most dominant factor to determine the resolution. Therefore, refinements of the moderator system to decrease the moderation time by decreasing a thickness of the moderator or by applying the decoupler system or application of the angular dispersive neutron diffraction technique are important to improve the resolution of the diffraction experiment using the compact neutron source. In contrast, the texture evolution due to plastic deformation was successfully observed by measuring a change in the diffraction peak intensity by RANS. Furthermore, the volume fraction of the austenitic phase in the dual phase mock specimen was also successfully evaluated by fitting the diffraction pattern using a Rietveld code. Consequently, RANS has been proved to be capable for neutron engineering diffraction aiming for the easy access

X-ray diffraction microtomography using synchrotron radiation

CERN Document Server

Barroso, R C; Jesus, E F O; Oliveira, L F

2001-01-01

The X-ray diffraction computed tomography technique is based on the interference phenomena of the coherent scatter. For low-momentum transfer, it is most probable that the scattering interaction will be coherent. A selective discrimination of a given element in a scanned specimen can be realized by fixing the Bragg angle which produces an interference peak and then, to carry out the computed tomography in the standard mode. The image reconstructed exalts the presence of this element with respect to other ones in a sample. This work reports the feasibility of a non-destructive synchrotron radiation X-ray diffraction imaging technique. This research was performed at the X-ray Diffraction beam line of the National Synchrotron Light Laboratory (LNLS) in Brazil. The coherent scattering properties of different tissue and bone substitute materials were evaluated. Furthermore, diffraction patterns of some polycrystalline solids were studied due to industrial and environmental human exposure to these metals. The obtai...

Nanocrystallite characterization of milled simulated dry process fuel powders by neutron diffraction

International Nuclear Information System (INIS)

Ryu, Ho Jin; Kang, Kwon Ho; Moon, Je Sun; Song, Kee Chan; Choi, Yong Nam

2003-01-01

The nano-scale crystallite sizes of simulated spent fuel powders were measured by the neutron diffraction line broadening method in order to analyze the sintering behavior of the dry process fuel. The mixed U0 2 and fission product oxide powders were dry-milled in an attritor for 30, 60, and 120 min. The diffraction patterns of the powders were obtained by using the high resolution powder diffractometer in the HANARO research reactor. Diffraction line broadening due to crystallite size was measured using various techniques such as the Stokes' deconvolution, profile fitting methods using Cauchy function, Gaussian function, and Voigt function, and the Warren-Averbach method. The r.m.s. strain, stacking fault, twin and dislocation density were measured using the information from the diffraction pattern. The realistic crystallite size can be obtained after separation of the contribution from the non-uniform strain, stacking fault and twin

Strain fields in crystalline solids: prediction and measurement of X- ray diffraction patterns and electron diffraction contrast images

NARCIS (Netherlands)

Bor, Teunis Cornelis

2000-01-01

Lattice imperfections, such as dislocations and misfitting particles, shift and/or broaden X-ray diffraction (XRD) line profiles. Most of the present analysis methods of the shift and broadening of XRD line profiles do not provide the characteristics of lattice imperfections. The main part of this

Application of the graphics processor unit to simulate a near field diffraction

Science.gov (United States)

Zinchik, Alexander A.; Topalov, Oleg K.; Muzychenko, Yana B.

2017-06-01

For many years, computer modeling program used for lecture demonstrations. Most of the existing commercial software, such as Virtual Lab, LightTrans GmbH company are quite expensive and have a surplus capabilities for educational tasks. The complexity of the diffraction demonstrations in the near zone, due to the large amount of calculations required to obtain the two-dimensional distribution of the amplitude and phase. At this day, there are no demonstrations, allowing to show the resulting distribution of amplitude and phase without much time delay. Even when using Fast Fourier Transform (FFT) algorithms diffraction calculation speed in the near zone for the input complex amplitude distributions with size more than 2000 × 2000 pixels is tens of seconds. Our program selects the appropriate propagation operator from a prescribed set of operators including Spectrum of Plane Waves propagation and Rayleigh-Sommerfeld propagation (using convolution). After implementation, we make a comparison between the calculation time for the near field diffraction: calculations made on GPU and CPU, showing that using GPU for calculations diffraction pattern in near zone does increase the overall speed of algorithm for an image of size 2048×2048 sampling points and more. The modules are implemented as separate dynamic-link libraries and can be used for lecture demonstrations, workshops, selfstudy and students in solving various problems such as the phase retrieval task.

Atomic-layer-resolved analysis of surface magnetism by diffraction spectroscopy

International Nuclear Information System (INIS)

Matsui, Fumihiko; Matsushita, Tomohiro; Daimon, Hiroshi

2010-01-01

X-ray absorption near edge structure (XANES) and X-ray magnetic circular dichroism (XMCD) measurements by Auger-electron-yield detection are powerful analysis tools for the electronic and magnetic structures of surfaces, but all the information from atoms within the electron mean-free-path range is summed into the obtained spectrum. In order to investigate the electronic and magnetic structures of each atomic layer at subsurface, we have proposed a new method, diffraction spectroscopy, which is the combination of X-ray absorption spectroscopy and Auger electron diffraction (AED). From a series of measured thickness dependent AED patterns, we deduced a set of atomic-layer-specific AED patterns arithmetically. Based on these AED patterns, we succeeded in disentangling obtained XANES and XMCD spectra into those from different atomic layers.

Ultrafast coherent diffractive imaging of nanoparticles using X-ray free-electron laser radiation

International Nuclear Information System (INIS)

Kassemeyer, Stephan

2014-01-01

Coherent diffractive imaging with X-ray free-electron lasers (X-FEL) promises high-resolution structure determination of single microscopic particles without the need for crystallization. The diffraction signal of small samples can be very weak, a difficulty that can not be countered by merely increasing the number of photons because the sample would be damaged by a high absorbed radiation dose. Traditional X-ray crystallography avoids this problem by bringing many sample particles into a periodic arrangement, which amplifies the individual signals while distributing the absorbed dose. Depending on the sample, however, crystallization can be very difficult or even impossible. This thesis presents algorithms for a new imaging approach using X-FEL radiation that works with single, non-crystalline sample particles. X-FELs can deliver X-rays with a peak brilliance many orders of magnitude higher than conventional X-ray sources, compensating for their weak interaction cross sections. At the same time, FELs can produce ultra-short pulses down to a few femtoseconds. In this way it is possible to perform ultra-fast imaging, essentially ''freezing'' the atomic positions in time and terminating the imaging process before the sample is destroyed by the absorbed radiation. This thesis primarily focuses on the three-dimensional reconstruction of single (and not necessarily crystalline) particles using coherent diffractive imaging at X-FELs: in order to extract three-dimensional information from scattering data, two-dimensional diffraction patterns from many different viewing angles must be combined. Therefore, the diffraction signal of many identical sample copies in random orientations is measured. The main result of this work is a globally optimal algorithm that can recover the sample orientations solely based on the diffraction signal, enabling three-dimensional imaging for arbitrary samples. The problem of finding three-dimensional orientations is

Interpretation of small-angle diffraction experiments on opal-like photonic crystals

Science.gov (United States)

Marlow, F.; Muldarisnur, M.; Sharifi, P.; Zabel, H.

2011-08-01

Comprehensive structural information on artificial opals involving the deviations from the strongly dominating face-centered cubic structure is still missing. Recent structure investigations with neutrons and synchrotron sources have shown a high degree of order but also a number of unexpected scattering features. Here, we point out that the exclusion of the allowed 002-type diffraction peaks by a small atomic form factor is not obvious and that surface scattering has to be included as a possible source for the diffraction peaks. Our neutron diffraction data indicate that surface scattering is the main reason for the smallest-angle peaks in the diffraction patterns.

Patterned basal seismicity shows sub-ice stream bedforms

Science.gov (United States)

Barcheck, C. G.; Tulaczyk, S. M.; Schwartz, S. Y.

2017-12-01

Patterns in seismicity emanating from the bottom of fast-moving ice streams and glaciers may indicate localized patches of higher basal resistance— sometimes called 'sticky spots', or otherwise varying basal properties. These seismogenic basal areas resist an unknown portion of the total driving stress of the Whillans Ice Plain (WIP), in West Antarctica, but may play an important role in the WIP stick-slip cycle and ice stream slowdown. To better understand the mechanism and importance of basal seismicity beneath the WIP, we analyze seismic data collected by a small aperture (micro-earthquakes in Dec 2014, and we compare the resulting map of seismicity to ice bottom depth measured by airborne radar. The number of basal earthquakes per area within the network is spatially heterogeneous, but a pattern of two 400m wide streaks of high seismicity rates is evident, with >50-500 earthquakes detected per 50x50m grid cell in 2 weeks. These seismically active streaks are elongated approximately in the ice flow direction with a spacing of 750m. Independent airborne radar measurements of ice bottom depth from Jan 2013 show a low-amplitude ( 5m) undulation in the basal topography superposed on a regional gradient in ice bottom depth. The flow-perpendicular wavelength of these low-amplitude undulations is comparable to the spacing of the high seismicity bands, and the streaks of high seismicity intersect local lows in the undulating basal topography. We interpret these seismic and radar observations as showing seismically active sub-ice stream bedforms that are low amplitude and elongated in the direction of ice flow, comparable to the morphology of mega scale glacial lineations (MSGLs), with high basal seismicity rates observed in the MSGL troughs. These results have implications for understanding the formation mechanism of MSGLS and well as understanding the interplay between basal topographic roughness, spatially varying basal till and hydrologic properties, basal

Photoelectron diffraction k-space volumes of the c(2x2) Mn/Ni(100) structure

Energy Technology Data Exchange (ETDEWEB)

Banerjee, S.; Denlinger, J.; Chen, X. [Univ. of Wisconsin, Milwaukee, WI (United States)] [and others

1997-04-01

Traditionally, x-ray photoelectron diffraction (XPD) studies have either been done by scanning the diffraction angle for fixed kinetic energy (ADPD), or scanning the kinetic energy at fixed exit angle (EDPD). Both of these methods collect subsets of the full diffraction pattern, or volume, which is the intensity of photoemission as a function of momentum direction and magnitude. With the high density available at the Spectromicroscopy Facility (BL 7.0) {open_quotes}ultraESCA{close_quotes} station, the authors are able to completely characterize the photoelectron diffraction patterns of surface structures, up to several hundred electron volts kinetic energy. This large diffraction `volume` can then be analyzed in many ways. The k-space volume contains as a subset the energy dependent photoelectron diffraction spectra along all emission angles. It also contains individual, hemispherical, diffraction patterns at specific kinetic energies. Other `cuts` through the data set are also possible, revealing new ways of viewing photoelectron diffraction data, and potentially new information about the surface structure being studied. In this article the authors report a brief summary of a structural study being done on the c(2x2) Mn/Ni(100) surface alloy. This system is interesting for both structural and magnetic reasons. Magnetically, the Mn/Ni(100) surface alloy exhibits parallel coupling of the Mn and Ni moments, which is opposite to the reported coupling for the bulk, disordered, alloy. Structurally, the Mn atoms are believed to lie well above the surface plane.

Suppressing Ghost Diffraction in E-Beam-Written Gratings

Science.gov (United States)

Wilson, Daniel; Backlund, Johan

2009-01-01

A modified scheme for electron-beam (E-beam) writing used in the fabrication of convex or concave diffraction gratings makes it possible to suppress the ghost diffraction heretofore exhibited by such gratings. Ghost diffraction is a spurious component of diffraction caused by a spurious component of grating periodicity as described below. The ghost diffraction orders appear between the main diffraction orders and are typically more intense than is the diffuse scattering from the grating. At such high intensity, ghost diffraction is the dominant source of degradation of grating performance. The pattern of a convex or concave grating is established by electron-beam writing in a resist material coating a substrate that has the desired convex or concave shape. Unfortunately, as a result of the characteristics of electrostatic deflectors used to control the electron beam, it is possible to expose only a small field - typically between 0.5 and 1.0 mm wide - at a given fixed position of the electron gun relative to the substrate. To make a grating larger than the field size, it is necessary to move the substrate to make it possible to write fields centered at different positions, so that the larger area is synthesized by "stitching" the exposed fields.

Design and fabrication of diffractive optical elements with MATLAB

National Research Council Canada - National Science Library

Bhattacharya, Shanti (Professor in Optics); Vijayakumar, Anand

2017-01-01

... their diffraction patterns using MATLAB. The fundamentals of fabrication techniques such as photolithography, electron beam lithography, and focused ion beam lithography with basic instructions for the beginner are presented...

Structure of lamellar lipid domains and corneocyte envelopes of murine stratum corneum. An X-ray diffraction study

International Nuclear Information System (INIS)

White, S.H.; Mirejovsky, D.; King, G.I.

1988-01-01

The lipid of the outermost layer of the skin is confined largely to the extracellular spaces surrounding the corneocytes of the stratum corneum where it forms a multilamellar adhesive matrix to act as the major permeability barrier of the skin. Knowledge of the molecular architecture of these intercellular domains is important for understanding various skin pathologies and their treatment, percutaneous drug delivery, and the cosmetic maintenance of the skin. The authors have surveyed by X-ray diffraction the structure of the intercellular domains and the extracted lipids of murine stratum corneum (SC) at 25, 45, and 70 0 C which are temperatures in the vicinity of known thermal phase transitions. The intercellular domains produce lamellar diffraction patterns with a Bragg spacing of 131 +/- 2 A. Lipid extracted from the SC and dispersed in excess water does not produce a simple lamellar diffraction pattern at any temperature studied, however. This and other facts suggest that another component, probably a protein, must be present to control the architecture of the intercellular lipid domains. They have also obtained diffraction patterns attributable to the protein envelopes of the corneocytes. The patterns suggest a β-pleated sheet organizational scheme. No diffraction patterns were observed that could be attributed to keratin

Reconstructing an icosahedral virus from single-particle diffraction experiments

Science.gov (United States)

Saldin, D. K.; Poon, H.-C.; Schwander, P.; Uddin, M.; Schmidt, M.

2011-08-01

The first experimental data from single-particle scattering experiments from free electron lasers (FELs) are now becoming available. The first such experiments are being performed on relatively large objects such as viruses, which produce relatively low-resolution, low-noise diffraction patterns in so-called ``diffract-and-destroy'' experiments. We describe a very simple test on the angular correlations of measured diffraction data to determine if the scattering is from an icosahedral particle. If this is confirmed, the efficient algorithm proposed can then combine diffraction data from multiple shots of particles in random unknown orientations to generate a full 3D image of the icosahedral particle. We demonstrate this with a simulation for the satellite tobacco necrosis virus (STNV), the atomic coordinates of whose asymmetric unit is given in Protein Data Bank entry 2BUK.

Probing the structure of heterogeneous diluted materials by diffraction tomography.

Science.gov (United States)

Bleuet, Pierre; Welcomme, Eléonore; Dooryhée, Eric; Susini, Jean; Hodeau, Jean-Louis; Walter, Philippe

2008-06-01

The advent of nanosciences calls for the development of local structural probes, in particular to characterize ill-ordered or heterogeneous materials. Furthermore, because materials properties are often related to their heterogeneity and the hierarchical arrangement of their structure, different structural probes covering a wide range of scales are required. X-ray diffraction is one of the prime structural methods but suffers from a relatively poor detection limit, whereas transmission electron analysis involves destructive sample preparation. Here we show the potential of coupling pencil-beam tomography with X-ray diffraction to examine unidentified phases in nanomaterials and polycrystalline materials. The demonstration is carried out on a high-pressure pellet containing several carbon phases and on a heterogeneous powder containing chalcedony and iron pigments. The present method enables a non-invasive structural refinement with a weight sensitivity of one part per thousand. It enables the extraction of the scattering patterns of amorphous and crystalline compounds with similar atomic densities and compositions. Furthermore, such a diffraction-tomography experiment can be carried out simultaneously with X-ray fluorescence, Compton and absorption tomographies, enabling a multimodal analysis of prime importance in materials science, chemistry, geology, environmental science, medical science, palaeontology and cultural heritage.

Diffractive generalized phase contrast for adaptive phase imaging and optical security

DEFF Research Database (Denmark)

Palima, Darwin; Glückstad, Jesper

2012-01-01

We analyze the properties of Generalized Phase Contrast (GPC) when the input phase modulation is implemented using diffractive gratings. In GPC applications for patterned illumination, the use of a dynamic diffractive optical element for encoding the GPC input phase allows for onthe- fly optimiza...... security applications and can be used to create phasebased information channels for enhanced information security....

X-Ray Diffraction and the Discovery of the Structure of DNA

Science.gov (United States)

Crouse, David T.

2007-01-01

A method is described for teaching the analysis of X-ray diffraction of DNA through a series of steps utilizing the original methods used by James Watson, Francis Crick, Maurice Wilkins and Rosalind Franklin. The X-ray diffraction pattern led to the conclusion of the basic helical structure of DNA and its dimensions while basic chemical principles…

Diamond-anvil cell for radial x-ray diffraction

International Nuclear Information System (INIS)

Chesnut, G N; Schiferl, D; Streetman, B D; Anderson, W W

2006-01-01

We have designed a new diamond-anvil cell capable of radial x-ray diffraction to pressures of a few hundred GPa. The diffraction geometry allows access to multiple angles of Ψ, which is the angle between each reciprocal lattice vector g(hkl) and the compression axis of the cell. At the 'magic angle', Ψ∼54.7 0 , the effects of deviatoric stresses on the interplanar spacings, d(hkl), are significantly reduced. Because the systematic errors, which are different for each d(hkl), are significantly reduced, the crystal structures and the derived equations of state can be determined reliably. At other values of Ψ, the effects of deviatoric stresses on the diffraction pattern could eventually be used to determine elastic constants

Tolerance analysis on diffraction efficiency and polychromatic integral diffraction efficiency for harmonic diffractive optics

Science.gov (United States)

Shan, Mao

2016-10-01

In this dissertation, the mathematical model of effect of manufacturing errors including microstructure relative height error and relative width error on diffraction efficiency for the harmonic diffractive optical elements (HDEs) is set up. According to the expression of the phase delay and diffraction efficiency of the HDEs, the expression of diffraction efficiency of refraction and diffractive optical element with the microstructure height and periodic width errors in fabrication process is presented in this paper. Furthermore, the effect of manufacturing errors on diffraction efficiency for the harmonic diffractive optical elements is studied, and diffraction efficiency change is analyzed as the relative microstructure height-error in the same and in the opposite sign as well as relative width-error in the same and in the opposite sign. Example including infrared wavelength with materials GE has been discussed in this paper. Two kinds of manufacturing errors applied in 3.7 4.3um middle infrared and 8.7-11.5um far infrared optical system which results in diffraction efficiency and PIDE of HDEs are studied. The analysis results can be used for manufacturing error control in micro-structure height and periodic width. Results can be used for HDEs processing.

Elucidating structural order and disorder phenomena in mullite-type Al4B2O9 by automated electron diffraction tomography

International Nuclear Information System (INIS)

Zhao, Haishuang; Krysiak, Yaşar; Hoffmann, Kristin; Barton, Bastian; Molina-Luna, Leopoldo; Neder, Reinhard B.; Kleebe, Hans-Joachim; Gesing, Thorsten M.; Schneider, Hartmut; Fischer, Reinhard X.

2017-01-01

The crystal structure and disorder phenomena of Al 4 B 2 O 9 , an aluminum borate from the mullite-type family, were studied using automated diffraction tomography (ADT), a recently established method for collection and analysis of electron diffraction data. Al 4 B 2 O 9 , prepared by sol-gel approach, crystallizes in the monoclinic space group C2/m. The ab initio structure determination based on three-dimensional electron diffraction data from single ordered crystals reveals that edge-connected AlO 6 octahedra expanding along the b axis constitute the backbone. The ordered structure (A) was confirmed by TEM and HAADF-STEM images. Furthermore, disordered crystals with diffuse scattering along the b axis are observed. Analysis of the modulation pattern implies a mean superstructure (AAB) with a threefold b axis, where B corresponds to an A layer shifted by ½a and ½c. Diffraction patterns simulated for the AAB sequence including additional stacking disorder are in good agreement with experimental electron diffraction patterns. - Graphical abstract: Crystal structure and disorder phenomena of B-rich Al 4 B 2 O 9 studied by automated electron diffraction tomography (ADT) and described by diffraction simulation using DISCUS. - Highlights: • Ab-initio structure solution by electron diffraction from single nanocrystals. • Detected modulation corresponding mainly to three-fold superstructure. • Diffuse diffraction streaks caused by stacking faults in disordered crystals. • Observed streaks explained by simulated electron diffraction patterns.

Slow scan sit detector for x-ray diffraction studies using synchrotron radiation

International Nuclear Information System (INIS)

Milch, J.R.

1978-01-01

A TV-type x-ray detector using a SIT vidicon has been used for biological diffraction studies at the EMBL outstation at DESY, Hamburg, Germany. The detector converts the two-dimensional diffraction pattern to a charge pattern on the vidicon target, which is read out in the slow-scan mode. This detector has high DOE, no count-rate limit, and is simple and inexpensive to construct. Radiation from the storage ring DORIS was used to study the structure of live muscle at various phases of contraction. Typically the count-rate on the detector was 10 6 x-rays/sec and a total exposure of a few seconds was needed to record the weak diffraction from muscle. This compares with usual exposure times of several hours using a rotating anode generator and film

The First X-ray Diffraction Patterns of Clay Minerals from Gale Crater

Science.gov (United States)

Bristow, Thomas; Blake, David; Bish, David L.; Vaniman, David; Ming, Douglas W.; Morris, Richard V.; Chipera, Steve; Rampe, Elizabeth B.; Farmer, Jack, D.; Treiman, Allan H;

Dynamics from diffraction

International Nuclear Information System (INIS)

Goodwin, Andrew L.; Tucker, Matthew G.; Cope, Elizabeth R.; Dove, Martin T.; Keen, David A.

2006-01-01

We explore the possibility that detailed dynamical information might be extracted from powder diffraction data. Our focus is a recently reported technique that employs statistical analysis of atomistic configurations to calculate dynamical properties from neutron total scattering data. We show that it is possible to access the phonon dispersion of low-frequency modes using such an approach, without constraining the results in terms of some pre-defined dynamical model. The high-frequency regions of the phonon spectrum are found to be less well preserved in the diffraction data

In-situ X-ray diffraction : a useful tool to investigate hydride-formation reactions

NARCIS (Netherlands)

Notten, P.H.L.; Daams, J.L.C.; Veirman, de A.E.M.; Staals, A.A.

1994-01-01

A high-pressure X-ray diffraction (XRD) cell has been designed which allowed us to study simultaneously hydrogen absorption/desorption isotherms and XRD powder diffraction patterns on (de)hydrided intermetallic compounds. The hydride formation reaction was investigated in the case of LaNi5 under

64nm pitch metal1 double patterning metrology: CD and OVL control by SEMCD, image based overlay and diffraction based overlay

Science.gov (United States)

Ducoté, Julien; Dettoni, Florent; Bouyssou, Régis; Le-Gratiet, Bertrand; Carau, Damien; Dezauzier, Christophe

2015-03-01

Patterning process control of advanced nodes has required major changes over the last few years. Process control needs of critical patterning levels since 28nm technology node is extremely aggressive showing that metrology accuracy/sensitivity must be finely tuned. The introduction of pitch splitting (Litho-Etch-Litho-Etch) at 14FDSOInm node requires the development of specific metrologies to adopt advanced process control (for CD, overlay and focus corrections). The pitch splitting process leads to final line CD uniformities that are a combination of the CD uniformities of the two exposures, while the space CD uniformities are depending on both CD and OVL variability. In this paper, investigations of CD and OVL process control of 64nm minimum pitch at Metal1 level of 14FDSOI technology, within the double patterning process flow (Litho, hard mask etch, line etch) are presented. Various measurements with SEMCD tools (Hitachi), and overlay tools (KT for Image Based Overlay - IBO, and ASML for Diffraction Based Overlay - DBO) are compared. Metrology targets are embedded within a block instanced several times within the field to perform intra-field process variations characterizations. Specific SEMCD targets were designed for independent measurement of both line CD (A and B) and space CD (A to B and B to A) for each exposure within a single measurement during the DP flow. Based on those measurements correlation between overlay determined with SEMCD and with standard overlay tools can be evaluated. Such correlation at different steps through the DP flow is investigated regarding the metrology type. Process correction models are evaluated with respect to the measurement type and the intra-field sampling.

Comparison of source moment tensor recovered by diffraction stacking migration and source time reversal imaging

Science.gov (United States)

Zhang, Q.; Zhang, W.

2017-12-01

Diffraction stacking migration is an automatic location methods and widely used in microseismic monitoring of the hydraulic fracturing. It utilizes the stacking of thousands waveform to enhance signal-to-noise ratio of weak events. For surface monitoring, the diffraction stacking method is suffered from polarity reverse among receivers due to radiation pattern of moment source. Joint determination of location and source mechanism has been proposed to overcome the polarity problem but needs significantly increased computational calculations. As an effective method to recover source moment tensor, time reversal imaging based on wave equation can locate microseismic event by using interferometry on the image to extract source position. However, the time reversal imaging is very time consuming compared to the diffraction stacking location because of wave-equation simulation.In this study, we compare the image from diffraction stacking and time reversal imaging to check if the diffraction stacking can obtain similar moment tensor as time reversal imaging. We found that image produced by taking the largest imaging value at each point along time axis does not exhibit the radiation pattern, while with the same level of calculation efficiency, the image produced for each trial origin time can generate radiation pattern similar to time reversal imaging procedure. Thus it is potential to locate the source position by the diffraction stacking method for general moment tensor sources.

Diffraction enhanced x-ray imaging

International Nuclear Information System (INIS)

Thomlinson, W.; Zhong, Z.; Johnston, R.E.; Sayers, D.

1997-09-01

Diffraction enhanced imaging (DEI) is a new x-ray radiographic imaging modality using synchrotron x-rays which produces images of thick absorbing objects that are almost completely free of scatter. They show dramatically improved contrast over standard imaging applied to the same phantoms. The contrast is based not only on attenuation but also the refraction and diffraction properties of the sample. The diffraction component and the apparent absorption component (absorption plus extinction contrast) can each be determined independently. This imaging method may improve the image quality for medical applications such as mammography

Diffraction and signal processing experiments with a liquid crystal microdisplay

International Nuclear Information System (INIS)

MartInez, Jose Luis; Moreno, Ignacio; Ahouzi, Esmail

2006-01-01

In this work, we show some diffraction experiments performed with a liquid crystal display (LCD) that shows how useful this device can be to teach and experience diffraction optics and signal processing experiments. The LCD acts as a programmable pixelated diffractive mask. The Fourier spectrum of the image displayed in the LCD is visualized through a simple free propagation diffraction experiment. This optical system allows easy testing of different diffractive elements. As a demonstration we include experimental results with well-known diffractive elements like diffraction gratings or Fresnel lenses, and with more complicated elements like computer-generated holograms

Diffraction and signal processing experiments with a liquid crystal microdisplay

Energy Technology Data Exchange (ETDEWEB)

MartInez, Jose Luis [Departamento de Ciencia y TecnologIa de Materiales, Universidad Miguel Hernandez de Elche, Alicante (Spain); Moreno, Ignacio [Departamento de Ciencia y TecnologIa de Materiales, Universidad Miguel Hernandez de Elche, Alicante (Spain); Ahouzi, Esmail [Institut National des Postes et Telecomunications (INTP), Madinat Al Irfane, Rabat (Morocco)

2006-09-01

In this work, we show some diffraction experiments performed with a liquid crystal display (LCD) that shows how useful this device can be to teach and experience diffraction optics and signal processing experiments. The LCD acts as a programmable pixelated diffractive mask. The Fourier spectrum of the image displayed in the LCD is visualized through a simple free propagation diffraction experiment. This optical system allows easy testing of different diffractive elements. As a demonstration we include experimental results with well-known diffractive elements like diffraction gratings or Fresnel lenses, and with more complicated elements like computer-generated holograms.

X-ray and electron diffraction studies of the structures of pseudo-perovskite compounds Pb2(Sc,Ta)O6 and Pb2(Mg,W)O6

International Nuclear Information System (INIS)

Baba-Kishi, K.Z.; Cernik, R.J.

1992-01-01

Electron diffraction patterns, X-ray precession patterns and synchrotron Rietveld powder diffraction profiles were used to study the crystal structure of the pseudo-perovskite compound Pb 2 (Sc, Ta)O 6 (PST). The results of a Rietveld refinement and single-crystal X-ray precession studies showed that PST has a lower symmetry than the cubic Fm3m in the paraelectric state. The remarkable similarities between the crystal structures of the antiferroelectric Pb 2 (Mg, W)O 6 (PMW) and ferroelectric PST are studied in detail by electron diffraction and it is suggested that PST is a weak or frustrated antiferroelectric oxide. The influence of the degree of structural long-range order on the existence of an antiferroelectric phase transition in PST and PMW is discussed. (orig.)

Design and fabrication of directional diffractive device on glass substrate for multiview holographic 3D display

Science.gov (United States)

Su, Yanfeng; Cai, Zhijian; Liu, Quan; Zou, Wenlong; Guo, Peiliang; Wu, Jianhong

2018-01-01

Multiview holographic 3D display based on the nano-grating patterned directional diffractive device can provide 3D images with high resolution and wide viewing angle, which has attracted considerable attention. However, the current directional diffractive device fabricated on the photoresist is vulnerable to damage, which will lead to the short service life of the device. In this paper, we propose a directional diffractive device on glass substrate to increase its service life. In the design process, the period and the orientation of the nano-grating at each pixel are carefully calculated accordingly by the predefined position of the viewing zone, and the groove parameters are designed by analyzing the diffraction efficiency of the nano-grating pixel on glass substrate. In the experiment, a 4-view photoresist directional diffractive device with a full coverage of pixelated nano-grating arrays is efficiently fabricated by using an ultraviolet continuously variable spatial frequency lithography system, and then the nano-grating patterns on the photoresist are transferred to the glass substrate by combining the ion beam etching and the reactive ion beam etching for controlling the groove parameters precisely. The properties of the etched glass device are measured under the illumination of a collimated laser beam with a wavelength of 532nm. The experimental results demonstrate that the light utilization efficiency is improved and optimized in comparison with the photoresist device. Furthermore, the fabricated device on glass substrate is easier to be replicated and of better durability and practicability, which shows great potential in the commercial applications of 3D display terminal.

Quantitative damage imaging using Lamb wave diffraction tomography

International Nuclear Information System (INIS)

Zhang Hai-Yan; Ruan Min; Zhu Wen-Fa; Chai Xiao-Dong

2016-01-01

In this paper, we investigate the diffraction tomography for quantitative imaging damages of partly through-thickness holes with various shapes in isotropic plates by using converted and non-converted scattered Lamb waves generated numerically. Finite element simulations are carried out to provide the scattered wave data. The validity of the finite element model is confirmed by the comparison of scattering directivity pattern (SDP) of circle blind hole damage between the finite element simulations and the analytical results. The imaging method is based on a theoretical relation between the one-dimensional (1D) Fourier transform of the scattered projection and two-dimensional (2D) spatial Fourier transform of the scattering object. A quantitative image of the damage is obtained by carrying out the 2D inverse Fourier transform of the scattering object. The proposed approach employs a circle transducer network containing forward and backward projections, which lead to so-called transmission mode (TMDT) and reflection mode diffraction tomography (RMDT), respectively. The reconstructed results of the two projections for a non-converted S0 scattered mode are investigated to illuminate the influence of the scattering field data. The results show that Lamb wave diffraction tomography using the combination of TMDT and RMDT improves the imaging effect compared with by using only the TMDT or RMDT. The scattered data of the converted A0 mode are also used to assess the performance of the diffraction tomography method. It is found that the circle and elliptical shaped damages can still be reasonably identified from the reconstructed images while the reconstructed results of other complex shaped damages like crisscross rectangles and racecourse are relatively poor. (special topics)

Takagi-Taupin description of x-ray dynamical diffraction from diffractive optics with large numerical aperture

International Nuclear Information System (INIS)

Yan Hanfei; Maser, Joerg; Macrander, Albert; Shen Qun; Vogt, Stefan; Stephenson, G. Brian; Kang, Hyon Chol

2007-01-01

We present a formalism of x-ray dynamical diffraction from volume diffractive optics with large numerical aperture and high aspect ratio, in an analogy to the Takagi-Taupin equations [Acta Crystallogr. 15, 1311 (1962); Bull. Soc. Fr. Mineral. Crystallogr. 87, 469 (1964)] for strained single crystals. We derive a set of basic equations for dynamical diffraction from volume diffractive optics, which enable us to study the focusing property of these optics with various grating profiles. We study volume diffractive optics that satisfy the Bragg condition to various degrees, namely, flat, tilted, and wedged geometries, and derive the curved geometries required for ultimate focusing. We show that the curved geometries satisfy both the Bragg condition everywhere and phase requirement for point focusing and effectively focus hard x rays to a scale close to the wavelength. Our calculations were made for an x-ray wavelength of 0.064 nm (19.5 keV)

Diffraction patterns in Fresnel approximation of periodic objects for a colorimeter of two apertures

Science.gov (United States)

Cortes-Reynoso, Jose-German R.; Suarez-Romero, Jose G.; Hurtado-Ramos, Juan B.; Tepichin-Rodriguez, Eduardo; Solorio-Leyva, Juan Carlos

2004-10-01

In this work, we present a study of Fresnel diffraction of periodic structures in an optical system of two apertures. This system of two apertures was used successfully for measuring color in textile samples solving the problems of illumination and directionality that present current commercial equipments. However, the system is sensible to the spatial frequency of the periodic sample"s area enclosed in its optical field of view. The study of Fresnel diffraction allows us to establish criteria for geometrical parameters of measurements in order to assure invariance in angular rotations and spatial positions. In this work, we use the theory of partial coherence to calculate the diffraction through two continuous apertures. In the calculation process, we use the concept of point-spread function of the system for partial coherence, in this way we avoid complicated statistical processes commonly used in the partial coherence theory.

X-ray diffraction, Raman and photoacoustic studies of InSb nanocrystals

Energy Technology Data Exchange (ETDEWEB)

Ersching, K., E-mail: kleb85@hotmail.com [Departamento de Fisica, Universidade Federal de Santa Catarina, Campus Universitario Trindade, 88040-900 Florianopolis, Santa Catarina (Brazil); Campos, C.E.M.; Lima, J.C. de; Grandi, T.A. [Departamento de Fisica, Universidade Federal de Santa Catarina, Campus Universitario Trindade, 88040-900 Florianopolis, Santa Catarina (Brazil); Souza, S.M. [Departamento de Engenharia Mecanica, Universidade Federal de Santa Catarina, Campus Universitario Trindade, 88040-900 Florianopolis, Santa Catarina (Brazil); Pizani, P.S. [Departamento de Fisica, Universidade Federal de Sao Carlos, 13 565-905 Sao Carlos, SP (Brazil)

2010-08-01

Zinc blend InSb nanocrystals were generated by mechanical alloying and X-ray diffraction, Raman spectroscopy and photoacoustic absorption spectroscopy techniques were used to study its structural, optical and thermal properties. Annealed nanocrystals were also studied. Residual amorphous and minority crystalline (Sb and In{sub 2}O{sub 3}) phases were also observed for mechanical alloyed and thermal annealed samples, respectively. The structural parameters, phase fractions, average crystallite sizes and microstrains of all crystalline phases found in the samples were obtained from Rietveld analyses of their X-ray diffraction patterns. Raman results for both as-milled and annealed samples show the Raman active LO and TO modes of the zinc blend InSb phase and Sb-rich regions. The photoacoustic results of both samples were satisfactorily explained by thermal bending heat transfer mechanism and an increase on effective thermal diffusivity coefficient was observed after annealing.

Observation of diffraction effects in positron channeling

International Nuclear Information System (INIS)

Palathingal, J.C.; Peng, J.P.; Lynn, K.G.; Wu, X.Y.; Schultz, P.J.

1994-01-01

An experimental investigation of positron channeling was made with a high-angular resolution apparatus, employing positrons of kinetic energy 1 MeV, derived from the Brookhaven National Laboratory Dynamitron. The pattern of transmission through a Si (100) single crystal of thickness 0.245 μm was investigated for a number of major planes. The authors have observed for the first time, in excellent detail, the fine structure of the channeling pattern expected to arise from the particle diffraction effects, theoretically explainable in terms of the quantum-mechanical many-beam calculations

Ultrafast molecular imaging by laser-induced electron diffraction

International Nuclear Information System (INIS)

Peters, M.; Nguyen-Dang, T. T.; Cornaggia, C.; Saugout, S.; Charron, E.; Keller, A.; Atabek, O.

2011-01-01

We address the feasibility of imaging geometric and orbital structures of a polyatomic molecule on an attosecond time scale using the laser-induced electron diffraction (LIED) technique. We present numerical results for the highest molecular orbitals of the CO 2 molecule excited by a near-infrared few-cycle laser pulse. The molecular geometry (bond lengths) is determined within 3% of accuracy from a diffraction pattern which also reflects the nodal properties of the initial molecular orbital. Robustness of the structure determination is discussed with respect to vibrational and rotational motions with a complete interpretation of the laser-induced mechanisms.

Nonparaxial propagation and focusing properties of azimuthal-variant vector fields diffracted by an annular aperture.

Science.gov (United States)

Gu, Bing; Xu, Danfeng; Pan, Yang; Cui, Yiping

2014-07-01

Based on the vectorial Rayleigh-Sommerfeld integrals, the analytical expressions for azimuthal-variant vector fields diffracted by an annular aperture are presented. This helps us to investigate the propagation behaviors and the focusing properties of apertured azimuthal-variant vector fields under nonparaxial and paraxial approximations. The diffraction by a circular aperture, a circular disk, or propagation in free space can be treated as special cases of this general result. Simulation results show that the transverse intensity, longitudinal intensity, and far-field divergence angle of nonparaxially apertured azimuthal-variant vector fields depend strongly on the azimuthal index, the outer truncation parameter and the inner truncation parameter of the annular aperture, as well as the ratio of the waist width to the wavelength. Moreover, the multiple-ring-structured intensity pattern of the focused azimuthal-variant vector field, which originates from the diffraction effect caused by an annular aperture, is experimentally demonstrated.

Study of the α and β phases of quartz by neutron multiple diffraction

International Nuclear Information System (INIS)

Mazzocchi, V.L.

1984-01-01

Crystal structures of α and β phases of quartz are studied, employing neutron multiple diffraction as a method of analysis. Theoretical multiple diffraction patterns in a many-beam case were determined by a computer program which calculates intensities of beams as sums of Taylor's series expansions, retaining terms up to a order n. Experimental 'umweg' and transmitted beam patterns were obtained for the 00.1 primary reflection of α and β phases of quartz. To calculate α - quartz multiple diffraction intensities it was necessary to determine the Dauphine twinning fraction for the crystal after having passed by the β-phase. For the two models of β-quartz a better agreement between experimental and calculated integrated intensities was found for the disordered structure model based on split-half-oxigen positions. (Author) [pt

Diffraction-limited real-time terahertz imaging by optical frequency up-conversion in a DAST crystal.

Science.gov (United States)

Fan, Shuzhen; Qi, Feng; Notake, Takashi; Nawata, Kouji; Takida, Yuma; Matsukawa, Takeshi; Minamide, Hiroaki

2015-03-23

Real-time terahertz (THz) wave imaging has wide applications in areas such as security, industry, biology, medicine, pharmacy, and the arts. This report describes real-time room-temperature THz imaging by nonlinear optical frequency up-conversion in an organic 4-dimethylamino-N'-methyl-4'-stilbazolium tosylate (DAST) crystal, with high resolution reaching the diffraction limit. THz-wave images were converted to the near infrared region and then captured using an InGaAs camera in a tandem imaging system. The resolution of the imaging system was analyzed. Diffraction and interference of THz wave were observed in the experiments. Videos are supplied to show the interference pattern variation that occurs with sample moving and tilting.

Structural studies of metal nanoparticles using high-energy x-ray diffraction

Energy Technology Data Exchange (ETDEWEB)

Kumara, L. S. R., E-mail: KUMARA.Rosantha@nims.go.jp; Yang, Anli; Song, Chulho [Synchrotron X-ray Station at SPring-8, National Institute for Materials Science (NIMS) 1-1-1 Kouto, Sayo, Hyogo, 679-5148 (Japan); Sakata, Osami, E-mail: SAKATA.Osami@nims.go.jp [Synchrotron X-ray Station at SPring-8, National Institute for Materials Science (NIMS) 1-1-1 Kouto, Sayo, Hyogo, 679-5148 (Japan); Synchrotron X-ray Group, Quantum Beam Unit, NIMS, 1-1-1 Kouto, Sayo, Hyogo, 679-5148 (Japan); Department of Innovative and Engineered Materials, Tokyo Institute of Technology, 4259-J3-16, Nagatsuta, Midori, Yokohama 226-8502 (Japan); Kohara, Shinji [Synchrotron X-ray Station at SPring-8, National Institute for Materials Science (NIMS) 1-1-1 Kouto, Sayo, Hyogo, 679-5148 (Japan); Synchrotron X-ray Group, Quantum Beam Unit, NIMS, 1-1-1 Kouto, Sayo, Hyogo, 679-5148 (Japan); Japan Synchrotron Radiation Research Institute (SPring-8/JASRI), 1-1-1 Kouto, Sayo, Hyogo 679-5198 (Japan); Kusada, Kohei; Kobayashi, Hirokazu [Division of Chemistry, Graduate School of Science, Kyoto University, Kitashirakawa Oiwake-cho, Sakyo-ku, Kyoto 606-8502 Japan (Japan); Kitagawa, Hiroshi [Division of Chemistry, Graduate School of Science, Kyoto University, Kitashirakawa Oiwake-cho, Sakyo-ku, Kyoto 606-8502 Japan (Japan); INAMORI Frontier Research Center, Kyushu University, 744 Motooka, Nishi-ku, Fukuoka 819-0395 Japan (Japan); Institute for Integrated Cell-Material Sciences (iCeMS), Kyoto University, Yoshida, Sakyo-ku, Kyoto 606-8501 Japan (Japan)

2016-07-27

The XRD patterns of nanoparticles exhibit broad Bragg peaks because of small size, where the contribution of diffuse component provides us with inherent structural information. Therefore, pair distribution function obtained from a Fourier transformation of high-energy XRD data and structure modeling on the basis of diffraction data becomes an essential tool to understand the structure of nanoparticles. This promising tool was utilized to obtain structural information of Pd/Pt bimetallic core/shell and solid-solution nanoparticles, which show much attention due to their improved hydrogen storage capacity and catalytic activity.

Imaging the proton via hard exclusive production in diffractive pp scattering

International Nuclear Information System (INIS)

Charles Hyde; Leonid Frankfurt; Mark Strikman; Christian Weiss

2007-01-01

We discuss the prospects for probing Generalized Parton Distributions (GPDs) via exclusive production of a high-mass system (H = heavy quarkonium, di-photon, di-jet, Higgs boson) in diffractive pp scattering, pp -> p + H + p. In such processes the interplay of hard and soft interactions gives rise to a diffraction pattern in the final-state proton transverse momenta, which is sensitive to the transverse spatial distribution of partons in the colliding protons. We comment on the plans for diffractive pp measurements at RHIC and LHC. Such studies could complement future measurements of GPDs in hard exclusive ep scattering (JLab, COMPASS, EIC)

Application of Powder Diffraction Methods to the Analysis of the Atomic Structure of Nanocrystals: The Concept of the Apparent Lattice Parameter (ALP)

Science.gov (United States)

Palosz, B.; Grzanka, E.; Gierlotka, S.; Stelmakh, S.; Pielaszek, R.; Bismayer, U.; Weber, H.-P.; Palosz, W.; Curreri, Peter A. (Technical Monitor)

2002-01-01

The applicability of standard methods of elaboration of powder diffraction data for determination of the structure of nano-size crystallites is analysed. Based on our theoretical calculations of powder diffraction data we show, that the assumption of the infinite crystal lattice for nanocrystals smaller than 20 nm in size is not justified. Application of conventional tools developed for elaboration of powder diffraction data, like the Rietveld method, may lead to erroneous interpretation of the experimental results. An alternate evaluation of diffraction data of nanoparticles, based on the so-called 'apparent lattice parameter' (alp) is introduced. We assume a model of nanocrystal having a grain core with well-defined crystal structure, surrounded by a surface shell with the atomic structure similar to that of the core but being under a strain (compressive or tensile). The two structural components, the core and the shell, form essentially a composite crystal with interfering, inseparable diffraction properties. Because the structure of such a nanocrystal is not uniform, it defies the basic definitions of an unambiguous crystallographic phase. Consequently, a set of lattice parameters used for characterization of simple crystal phases is insufficient for a proper description of the complex structure of nanocrystals. We developed a method of evaluation of powder diffraction data of nanocrystals, which refers to a core-shell model and is based on the 'apparent lattice parameter' methodology. For a given diffraction pattem, the alp values are calculated for every individual Bragg reflection. For nanocrystals the alp values depend on the diffraction vector Q. By modeling different a0tomic structures of nanocrystals and calculating theoretically corresponding diffraction patterns using the Debye functions we showed, that alp-Q plots show characteristic shapes which can be used for evaluation of the atomic structure of the core-shell system. We show, that using a simple

Single Hit Energy-resolved Laue Diffraction

Energy Technology Data Exchange (ETDEWEB)

Patel, Shamim; Suggit, Matthew J.; Stubley, Paul G.; Ciricosta, Orlando; Wark, Justin S.; Higginbotham, Andrew [Clarendon Laboratory, Department of Physics, University of Oxford, Parks Road, Oxford OX1 3PU (United Kingdom); Hawreliak, James A.; Collins, Gilbert W.; Eggert, Jon H. [Lawrence Livermore National Laboratory, Livermore, California 94550 (United States); Comley, Andrew J.; Foster, John M. [Atomic Weapons Establishment, Aldermaston, Reading RG7 4PR (United Kingdom)

2015-05-15

In situ white light Laue diffraction has been successfully used to interrogate the structure of single crystal materials undergoing rapid (nanosecond) dynamic compression up to megabar pressures. However, information on strain state accessible via this technique is limited, reducing its applicability for a range of applications. We present an extension to the existing Laue diffraction platform in which we record the photon energy of a subset of diffraction peaks. This allows for a measurement of the longitudinal and transverse strains in situ during compression. Consequently, we demonstrate measurement of volumetric compression of the unit cell, in addition to the limited aspect ratio information accessible in conventional white light Laue. We present preliminary results for silicon, where only an elastic strain is observed. VISAR measurements show the presence of a two wave structure and measurements show that material downstream of the second wave does not contribute to the observed diffraction peaks, supporting the idea that this material may be highly disordered, or has undergone large scale rotation.

Single Hit Energy-resolved Laue Diffraction

International Nuclear Information System (INIS)

Patel, Shamim; Suggit, Matthew J.; Stubley, Paul G.; Ciricosta, Orlando; Wark, Justin S.; Higginbotham, Andrew; Hawreliak, James A.; Collins, Gilbert W.; Eggert, Jon H.; Comley, Andrew J.; Foster, John M.

2015-01-01

In situ white light Laue diffraction has been successfully used to interrogate the structure of single crystal materials undergoing rapid (nanosecond) dynamic compression up to megabar pressures. However, information on strain state accessible via this technique is limited, reducing its applicability for a range of applications. We present an extension to the existing Laue diffraction platform in which we record the photon energy of a subset of diffraction peaks. This allows for a measurement of the longitudinal and transverse strains in situ during compression. Consequently, we demonstrate measurement of volumetric compression of the unit cell, in addition to the limited aspect ratio information accessible in conventional white light Laue. We present preliminary results for silicon, where only an elastic strain is observed. VISAR measurements show the presence of a two wave structure and measurements show that material downstream of the second wave does not contribute to the observed diffraction peaks, supporting the idea that this material may be highly disordered, or has undergone large scale rotation

X-ray powder diffraction data on miscellaneous lanthanide compounds

International Nuclear Information System (INIS)

Ferguson, I.F.; Hughes, T.E.

1978-08-01

Recent work on neutron absorbing materials has produced various new X-ray diffraction powder patterns of compounds of the lanthanides. Various inconsistencies in previously published data have been noted, and accurate measurements have been made of the lattice parameters of the rare earth oxides Sm 2 0 3 , Eu 2 0 3 , Gd 2 0 3 which have the monoclinic rare earth type B- structure, as well as Eu0. These data are recorded for reference. The optimum conditions for obtaining X-ray powder diffraction data from europium compounds are also noted. (author)

LACDIF, a new electron diffraction technique obtained with the LACBED configuration and a C{sub s} corrector: Comparison with electron precession

Energy Technology Data Exchange (ETDEWEB)

Morniroli, J.P. [Laboratoire de Metallurgie Physique et Genie des Materiaux, UMR CNRS 8517, USTL and ENSCL, Cite Scientifique, 59655 Villeneuve d' Ascq (France)], E-mail: jean-paul.morniroli@univ-lille1.fr; Houdellier, F.; Roucau, C. [CEMES-CNRS, 29 Rue Jeanne Marvig, BP 94347, 31055 Toulouse Cedex 4 (France); Puiggali, J.; Gesti, S. [Departament d' Enginyeria Quimica, Universitat Politecnica de Catalunya, Av. Diagonal 647, 08028 Barcelona (Spain); Redjaimia, A. [Laboratoire de Science et Genie des Surfaces, UMR CNRS 7570, Ecole des Mines de Nancy, Parc de Saurupt 54042 Nancy (France)

2008-01-15

By combining the large-angle convergent-beam electron diffraction (LACBED) configuration together with a microscope equipped with a C{sub s} corrector it is possible to obtain good quality spot patterns in image mode and not in diffraction mode as it is usually the case. These patterns have two main advantages with respect to the conventional selected-area electron diffraction (SAED) or microdiffraction patterns. They display a much larger number of reflections and the diffracted intensity is the integrated intensity. These patterns have strong similarities with the electron precession patterns and they can be used for various applications like the identification of the possible space groups of a crystal from observations of the Laue zones or the ab-initio structure identifications. Since this is a defocused method, another important application concerns the analysis of electron beam-sensitive materials. Successful applications to polymers are given in the present paper to prove the validity of this method with regards to these materials.

Computational imaging using lightweight diffractive-refractive optics

KAUST Repository

Peng, Yifan

2015-11-23

Diffractive optical elements (DOE) show great promise for imaging optics that are thinner and more lightweight than conventional refractive lenses while preserving their light efficiency. Unfortunately, severe spectral dispersion currently limits the use of DOEs in consumer-level lens design. In this article, we jointly design lightweight diffractive-refractive optics and post-processing algorithms to enable imaging under white light illumination. Using the Fresnel lens as a general platform, we show three phase-plate designs, including a super-thin stacked plate design, a diffractive-refractive-hybrid lens, and a phase coded-aperture lens. Combined with cross-channel deconvolution algorithm, both spherical and chromatic aberrations are corrected. Experimental results indicate that using our computational imaging approach, diffractive-refractive optics is an alternative candidate to build light efficient and thin optics for white light imaging.

Computational imaging using lightweight diffractive-refractive optics

KAUST Repository

Peng, Yifan; Fu, Qiang; Amata, Hadi; Su, Shuochen; Heide, Felix; Heidrich, Wolfgang

2015-01-01

Diffractive optical elements (DOE) show great promise for imaging optics that are thinner and more lightweight than conventional refractive lenses while preserving their light efficiency. Unfortunately, severe spectral dispersion currently limits the use of DOEs in consumer-level lens design. In this article, we jointly design lightweight diffractive-refractive optics and post-processing algorithms to enable imaging under white light illumination. Using the Fresnel lens as a general platform, we show three phase-plate designs, including a super-thin stacked plate design, a diffractive-refractive-hybrid lens, and a phase coded-aperture lens. Combined with cross-channel deconvolution algorithm, both spherical and chromatic aberrations are corrected. Experimental results indicate that using our computational imaging approach, diffractive-refractive optics is an alternative candidate to build light efficient and thin optics for white light imaging.

Direct observation of the formation of silver precipitations by means of electron diffraction

International Nuclear Information System (INIS)

Benz, V.; Ostwald, R.; Weil, K.G.

1976-01-01

Thin films (20-1,000 A) of copper (I)-, silver, and lead(II)-halides were prepared by evaporation onto silver (III), gold (III), and PbTe (III)-surfaces. These films were irradiated in vacuo with 40 kV-electrons, in some cases also with the light of a Xenon-lamp. At the same time the diffraction pattern, produced by the electron beam at glancing incidence, was observed and registered photographically. Silver precipitates could be detected by their diffraction pattern, when the crystallites had grown to a size of about 50 A. From all materials investigated silveriodide showed maximum sensitivity. The precipitates formed show no orientation with respect to the host crystal. From the temperature dependence of the sensitivity an activation energy of 0.12 eV can be deduced leading to interstitial ion migration as rate determining step. Pure silverchloride can not been radiolyzed by 40 kV-electrons. After doping it with 0.3 mol% CaCl 2 or MgCl 2 it becomes very sensitive. The precipitate showes orientation with respect to the host lattice. Also pure CuJ is resistant against the electron beam. Mixed crystals (Ag, Cu)J with xsub(AgJ) > 0.5 behave similar as pure AgJ. Pb(II)-halides show no sensitivity, but the compounds AgBr x 2 PbBr 2 and 5 AgJ x PbJ 2 are readily radiolyzed, forming polycrystalline silver precipitates. The mechanism of radiolysis, its dependency on temperature and film thickness is discussed. (orig.) [de

Low-kilovolt coherent electron diffractive imaging instrument based on a single-atom electron source

Energy Technology Data Exchange (ETDEWEB)

Lin, Chun-Yueh [Department of Physics, National Taiwan University, Taipei 10617, Taiwan (China); Chang, Wei-Tse; Chen, Yi-Sheng; Hwu, En-Te; Chang, Chia-Seng; Hwang, Ing-Shouh, E-mail: ishwang@phys.sinica.edu.tw [Institute of Physics, Academia Sinica, Nankang, Taipei 11529, Taiwan (China); Hsu, Wei-Hao [Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan (China)

2016-03-15

In this work, a transmission-type, low-kilovolt coherent electron diffractive imaging instrument was constructed. It comprised a single-atom field emitter, a triple-element electrostatic lens, a sample holder, and a retractable delay line detector to record the diffraction patterns at different positions behind the sample. It was designed to image materials thinner than 3 nm. The authors analyzed the asymmetric triple-element electrostatic lens for focusing the electron beams and achieved a focused beam spot of 87 nm on the sample plane at the electron energy of 2 kV. High-angle coherent diffraction patterns of a suspended graphene sample corresponding to (0.62 Å){sup −1} were recorded. This work demonstrated the potential of coherent diffractive imaging of thin two-dimensional materials, biological molecules, and nano-objects at a voltage between 1 and 10 kV. The ultimate goal of this instrument is to achieve atomic resolution of these materials with high contrast and little radiation damage.

Phase analysis of nano-phase materials using selected area electron diffraction in the TEM

International Nuclear Information System (INIS)

Labar, J. L.

2002-01-01

In analogy to X-ray power diffraction (XRD), we are developing a method to help phase identification when examining a large number of grains simultaneously by electron diffraction. Although XRD is well established, it can not be used for small quantities of materials (volumes below 1 mm 3 ). Examining a usual TEM sample with thickness of 100 nm and using a selected area of 1 mm in diameter, the selected area electron diffraction pattern (SAED) carries information about several thousands of grains from a material with an average grain size of about 10 nm. The accuracy of XRD can not be attained by electron diffraction (ED). However, simultaneous visual observation of the nanostructure is an additional benefit of TEM (beside the small amount of needed material). The first step of the development project was the development of a computer program ('ProcessDiffraction') that processes digital versions of SAED patterns and presents them in an XRD-like form (intensity vs. scattering vector). In the present version (V2.0.3) phase identification is carried out by comparing the measured distribution to 'Markers', i.e. data of known phases. XRD data cards are used if the detailed structure of a phase is not known. Kinematic electron diffraction intensities are calculated for phases with known atomic positions (Author)

Sensitivity of photoelectron diffraction to conformational changes of adsorbed molecules: Tetra-tert-butyl-azobenzene/Au(111

Directory of Open Access Journals (Sweden)

A. Schuler

2017-01-01

Full Text Available Electron diffraction is a standard tool to investigate the atomic structure of surfaces, interfaces, and adsorbate systems. In particular, photoelectron diffraction is a promising candidate for real-time studies of structural dynamics combining the ultimate time resolution of optical pulses and the high scattering cross-sections for electrons. In view of future time-resolved experiments from molecular layers, we studied the sensitivity of photoelectron diffraction to conformational changes of only a small fraction of molecules in a monolayer adsorbed on a metallic substrate. 3,3′,5,5′-tetra-tert-butyl-azobenzene served as test case. This molecule can be switched between two isomers, trans and cis, by absorption of ultraviolet light. X-ray photoelectron diffraction patterns were recorded from tetra-tert-butyl-azobenzene/Au(111 in thermal equilibrium at room temperature and compared to patterns taken in the photostationary state obtained by exposing the surface to radiation from a high-intensity helium discharge lamp. Difference patterns were simulated by means of multiple-scattering calculations, which allowed us to determine the fraction of molecules that underwent isomerization.

Pair distribution functions of carbonaceous solids, determined using energy filtered diffraction

International Nuclear Information System (INIS)

Petersen, T.C.; McCulloch, D.G.

2002-01-01

Full text: The structures of various carbonaceous solids were investigated using energy filtered diffraction patterns collected in two dimensions using a Gatan Imaging Filter (GIF). In order to reduce multiple scattering and eliminate inelastic scattering effects, the diffraction patterns were filtered using an energy -selecting slit around the zero-loss peak. Software has been developed for the extraction of radially averaged pair distributions functions from the diffraction data. This entails finding the position of the un-scattered beam, radially averaging the two dimensional intensity distributions, calibrating the resulting one dimensional intensity profiles and finally normalising the data to obtain structure factors. Techniques for improving and assessing data quality, pertaining to the methodology used here, have also been explored. Structure factors and radial distribution functions generated using this analysis will be discussed and, for the commercial V25 glassy carbon samples, compared to previous, work of one of the authors'. In order to answer questions regarding multiple scattering effects and structural homogeneity of the samples, neutron scattering was performed on the Medium Resolution Powder Diffractometer (MRPD), at the Australian Nuclear Science and Technology's (ANSTO) facility. A critical comparison of the neutron scattering and electron diffraction generated structure factors will be presented. Copyright (2002) Australian Society for Electron Microscopy Inc

The use of pattern decomposition to study the combined X-ray diffraction effects of crystallite size and stacking faults in ex-oxalate zinc oxide

International Nuclear Information System (INIS)

Langford, J.I.; Boultif, A.; Auffredic, J.P.; Louer, D.

1993-01-01

The microstructure of ZnO powder, obtained from thermal decomposition of the oxalate and studied previously by electron microscopy and adsorption calorimetry, was investigated by means of X-ray powder diffraction pattern decomposition. A Williamson-Hall plot revealed that some lines were broadened solely due to the effects of crystallite size, whereas other breadths included a contribution due to stacking faults. Spherical and cylindrical models are used to describe the form of the crystallites and procedures are presented for separating 'size' effects from 'mistake' broadening. This leads to estimates of the mean dimensions of the crystallites and the stacking-fault probability. The analysis demonstrates that, with good-quality data for a large number of reflections, a considerable amount of detailed information can be obtained about microstructure. On the other hand, it reveals some of the limitations of current procedures for modelling diffraction line profiles. (orig.)

Elucidating structural order and disorder phenomena in mullite-type Al{sub 4}B{sub 2}O{sub 9} by automated electron diffraction tomography

Energy Technology Data Exchange (ETDEWEB)

Zhao, Haishuang; Krysiak, Yaşar [Institute of Inorganic Chemistry and Analytical Chemistry, Jakob-Welder-Weg 11, Johannes Gutenberg-University Mainz, 55128 Mainz (Germany); Hoffmann, Kristin [Crystallography, Department of Geosciences, Klagenfurter Str. 2, GEO, University of Bremen, 28359 Bremen (Germany); Institute of Inorganic Chemistry and Crystallography, Leobener Str. NW2, University of Bremen, 28359 Bremen (Germany); Barton, Bastian [Institute of Inorganic Chemistry and Analytical Chemistry, Jakob-Welder-Weg 11, Johannes Gutenberg-University Mainz, 55128 Mainz (Germany); Molina-Luna, Leopoldo [Department of Materials and Geoscience, Technische Universität Darmstadt, Petersenstr. 23, 64287 Darmstadt (Germany); Neder, Reinhard B. [Department of Physics, Lehrstuhl für Kristallographie und Strukturphysik, Friedrich-Alexander University Erlangen-Nürnberg, Staudtstr.3, 91058 Erlangen (Germany); Kleebe, Hans-Joachim [Department of Materials and Geoscience, Technische Universität Darmstadt, Petersenstr. 23, 64287 Darmstadt (Germany); Gesing, Thorsten M. [Institute of Inorganic Chemistry and Crystallography, Leobener Str. NW2, University of Bremen, 28359 Bremen (Germany); MAPEX Center for Materials and Processes, Bibliothekstr.1, University of Bremen, 28359 Bremen (Germany); Schneider, Hartmut [Crystallography, Department of Geosciences, Klagenfurter Str. 2, GEO, University of Bremen, 28359 Bremen (Germany); Fischer, Reinhard X. [Crystallography, Department of Geosciences, Klagenfurter Str. 2, GEO, University of Bremen, 28359 Bremen (Germany); MAPEX Center for Materials and Processes, Bibliothekstr.1, University of Bremen, 28359 Bremen (Germany); and others

2017-05-15

The crystal structure and disorder phenomena of Al{sub 4}B{sub 2}O{sub 9}, an aluminum borate from the mullite-type family, were studied using automated diffraction tomography (ADT), a recently established method for collection and analysis of electron diffraction data. Al{sub 4}B{sub 2}O{sub 9}, prepared by sol-gel approach, crystallizes in the monoclinic space group C2/m. The ab initio structure determination based on three-dimensional electron diffraction data from single ordered crystals reveals that edge-connected AlO{sub 6} octahedra expanding along the b axis constitute the backbone. The ordered structure (A) was confirmed by TEM and HAADF-STEM images. Furthermore, disordered crystals with diffuse scattering along the b axis are observed. Analysis of the modulation pattern implies a mean superstructure (AAB) with a threefold b axis, where B corresponds to an A layer shifted by ½a and ½c. Diffraction patterns simulated for the AAB sequence including additional stacking disorder are in good agreement with experimental electron diffraction patterns. - Graphical abstract: Crystal structure and disorder phenomena of B-rich Al{sub 4}B{sub 2}O{sub 9} studied by automated electron diffraction tomography (ADT) and described by diffraction simulation using DISCUS. - Highlights: • Ab-initio structure solution by electron diffraction from single nanocrystals. • Detected modulation corresponding mainly to three-fold superstructure. • Diffuse diffraction streaks caused by stacking faults in disordered crystals. • Observed streaks explained by simulated electron diffraction patterns.

Symmetry, stability, and diffraction properties of icosahedral crystals

International Nuclear Information System (INIS)

Bak, P.

1985-01-01

In a remarkable experiment on an Mn-Al alloy, Shechtman et al. observed a diffraction spectrum with icosahedral symmetry. This is inconsistent with discrete translational invariance since the symmetry includes a five-fold axis. In this paper, it is shown that the crystallography and diffraction pattern can be described by a six-dimensional space group. The crystal structure in 3d is obtained as a cut along a 3d hyperplane in a regular 6d crystal. Displacements of the 6d crystal along 6 orthogonal directions define 6 continuous symmetries for the icosahedral crystal, three of which are phase symmetries describing internal rearrangements of the atoms

Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping

Energy Technology Data Exchange (ETDEWEB)

Pekin, Thomas C. [Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, USA 94720 (United States); National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, USA 94720 (United States); Gammer, Christoph [Erich Schmid Institute of Materials Science, Jahnstrasse 12, Leoben, Austria 8700 (Austria); Ciston, Jim [National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, USA 94720 (United States); Minor, Andrew M. [Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, USA 94720 (United States); National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, USA 94720 (United States); Ophus, Colin, E-mail: cophus@gmail.com [National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, USA 94720 (United States)

2017-05-15

Scanning nanobeam electron diffraction strain mapping is a technique by which the positions of diffracted disks sampled at the nanoscale over a crystalline sample can be used to reconstruct a strain map over a large area. However, it is important that the disk positions are measured accurately, as their positions relative to a reference are directly used to calculate strain. In this study, we compare several correlation methods using both simulated and experimental data in order to directly probe susceptibility to measurement error due to non-uniform diffracted disk illumination structure. We found that prefiltering the diffraction patterns with a Sobel filter before performing cross correlation or performing a square-root magnitude weighted phase correlation returned the best results when inner disk structure was present. We have tested these methods both on simulated datasets, and experimental data from unstrained silicon as well as a twin grain boundary in 304 stainless steel.

Spatially resolved determination of lattice distortions in silicon nanostructures by means of electron-backscattering diffraction

International Nuclear Information System (INIS)

Krause, Michael

2013-01-01

In the submitted thesis, a novel combined approach of both focused ion beam (FIB) based target preparation and strain determination using electron backscatter diffraction (EBSD) in semiconductor nanostructures is presented. In the first part, a powerful cross-correlation algorithm for detecting small feature shifts within EBSD patterns and, consequently, determining the strain, is presented. The corresponding strain sensitivity is demonstrated using dynamically simulated diffraction patterns. Furthermore, novel procedures for automated pattern analysis are introduced. Results of systematic studies concerning the influence of ion species, ion energy and dose density on the surface quality of silicon surfaces are presented in the second part. For that matter, the assessment of surface amorphization and rippling is based on high resolution microstructural diagnostics (TEM, AFM, Raman) and molecular dynamics simulation. The high application potential of combined FIB preparation and strain analysis using EBSD is exemplarily demonstrated for a 60 nm thick sSOI-sample. The good agreement with established techniques like Raman spectroscopy and X-ray diffraction is also shown.

Diffraction theory

NARCIS (Netherlands)

Bouwkamp, C.J.

1954-01-01

A critical review is presented of recent progress in classical diffraction theory. Both scalar and electromagnetic problems are discussed. The report may serve as an introduction to general diffraction theory although the main emphasis is on diffraction by plane obstacles. Various modifications of

Local, atomic-level elastic strain measurements of metallic glass thin films by electron diffraction

Energy Technology Data Exchange (ETDEWEB)

Ebner, C. [Physics of Nanostructured Materials, Faculty of Physics, University of Vienna, Boltzmanngasse 5, 1090 Vienna (Austria); Sarkar, R. [Department of Materials Science and Engineering, School for Engineering of Matter Transport and Energy, Arizona State University, Tempe 85287 (United States); Rajagopalan, J. [Department of Materials Science and Engineering, School for Engineering of Matter Transport and Energy, Arizona State University, Tempe 85287 (United States); Department of Mechanical and Aerospace Engineering, School for Engineering of Matter Transport and Energy, Arizona State University, Tempe 85287 (United States); Rentenberger, C., E-mail: christian.rentenberger@univie.ac.at [Physics of Nanostructured Materials, Faculty of Physics, University of Vienna, Boltzmanngasse 5, 1090 Vienna (Austria)

2016-06-15

A novel technique is used to measure the atomic-level elastic strain tensor of amorphous materials by tracking geometric changes of the first diffuse ring of selected area electron diffraction patterns (SAD). An automatic procedure, which includes locating the centre and fitting an ellipse to the diffuse ring with sub-pixel precision is developed for extracting the 2-dimensional strain tensor from the SAD patterns. Using this technique, atomic-level principal strains from micrometre-sized regions of freestanding amorphous Ti{sub 0.45}Al{sub 0.55} thin films were measured during in-situ TEM tensile deformation. The thin films were deformed using MEMS based testing stages that allow simultaneous measurement of the macroscopic stress and strain. The calculated atomic-level principal strains show a linear dependence on the applied stress, and good correspondence with the measured macroscopic strains. The calculated Poisson’s ratio of 0.23 is reasonable for brittle metallic glasses. The technique yields a strain accuracy of about 1×10{sup −4} and shows the potential to obtain localized strain profiles/maps of amorphous thin film samples. - Highlights: • A TEM method to measure elastic strain in metallic glass films is proposed. • Method is based on tracking geometric changes in TEM diffraction patterns. • An automatic procedure is developed for extracting the local strain tensor. • Atomic-level strain in amorphous TiAl film was analysed during in-situ deformation. • Capability of the method to obtain micrometer scale strain profiles/maps is shown.

CL 19: Anisotropy of the electron diffraction from femtosecond Laser excited Bismuth

International Nuclear Information System (INIS)

Zhou, P.; Ligges, M.; Streubuehr, C.; Brazda, Th.; Payer, Th.; Meyer zu Heringdorf, F.; Horn-von Hoegen, M.; Von der Linde, D.

2010-01-01

We report an electron diffraction experiment in Bi in which a linearly polarized E g optical phonon mode is detected after excitation of the material by a femtosecond laser pulse. Bismuth is a semimetal with rhombohedral crystal structure with two atoms in the unit cell. There are two types of optical phonon modes: (i) The totally symmetric A 1g mode which corresponds to a displacement of the atoms along the trigonal (111) direction, and (ii) the doubly degenerate E g mode which represents a motion in the plane perpendicular to (111). The A 1g mode can be coherently excited both by displacive excitation (DE) and by impulsive stimulated Raman scattering (ISRS). Symmetry properties prevent DE of E g modes leaving ISRS as a likely excitation mechanism. We performed time resolved electron diffraction experiments on femtosecond laser excited Bi membranes of 15 nm thickness which were grown on a NaCl crystal and detached by floating in water. The experimental setup is described elsewhere. The fundamental laser beam (800 nm) was used for the excitation of the Bi films. The films had a crystalline structure with the (111) axis perpendicular to the surface. The electron beam passed perpendicular to the surface through the film. In this geometry the diffraction pattern is insensitive to atomic displacements along the (111) direction, i.e. insensitive to A 1g phonon modes. On the other hand, the excitation of E g modes corresponding to atomic displacements in the plane normal to (111) decreases the intensity of particular diffraction orders. The individual cycles of the E g vibrations (duration 475 fs) could not be resolved because our time resolution about 700 fs was not sufficient. In our experiment excitation beam with a fluence of 1 mJ/cm 2 and variable linear polarization was incident from the backside at an angle of 40 degrees (counter propagating electron and laser beam). The diffraction patterns were recorded as a function of the delay time between laser pump and

Coherent 3D nanostructure of γ-Al{sub 2}O{sub 3}: Simulation of whole X-ray powder diffraction pattern

Energy Technology Data Exchange (ETDEWEB)

Pakharukova, V.P., E-mail: verapakh@catalysis.ru [Boreskov Institute of Catalysis SB RAS, Pr. Lavrentieva 5, 630090 Novosibirsk (Russian Federation); Novosibirsk State University, Pirogova Street 2, 630090 Novosibirsk (Russian Federation); Research and Educational Center for Energy Efficient Catalysis, Novosibirsk State University, Novosibirsk 630090 (Russian Federation); Yatsenko, D.A. [Boreskov Institute of Catalysis SB RAS, Pr. Lavrentieva 5, 630090 Novosibirsk (Russian Federation); Novosibirsk State University, Pirogova Street 2, 630090 Novosibirsk (Russian Federation); Gerasimov, E. Yu.; Shalygin, A.S.; Martyanov, O.N.; Tsybulya, S.V. [Boreskov Institute of Catalysis SB RAS, Pr. Lavrentieva 5, 630090 Novosibirsk (Russian Federation); Novosibirsk State University, Pirogova Street 2, 630090 Novosibirsk (Russian Federation); Research and Educational Center for Energy Efficient Catalysis, Novosibirsk State University, Novosibirsk 630090 (Russian Federation)

2017-02-15

The structure and nanostructure features of nanocrystalline γ-Al{sub 2}O{sub 3} obtained by dehydration of boehmite with anisotropic platelet-shaped particles were investigated. The original models of 3D coherent nanostructure of γ-Al{sub 2}O{sub 3} were constructed. The models of nanostructured γ-Al{sub 2}O{sub 3} particles were first confirmed by a direct simulation of powder X–Ray diffraction (XRD) patterns using the Debye Scattering Equation (DSE) with assistance of high-resolution transmission electron microscopy (HRTEM) study. The average crystal structure of γ-Al{sub 2}O{sub 3} was shown to be tetragonally distorted. The experimental results revealed that thin γ-Al{sub 2}O{sub 3} platelets were heterogeneous on a nanometer scale and nanometer-sized building blocks were separated by partially coherent interfaces. The XRD simulation results showed that a specific packing of the primary crystalline blocks in the nanostructured γ-Al{sub 2}O{sub 3} particles with formation of planar defects on (001), (100), and (101) planes nicely accounted for pronounced diffuse scattering, anisotropic peak broadening and peak shifts in the experimental XRD pattern. The identified planar defects in cation sublattice seem to be described as filling cation non-spinel sites in existing crystallographic models of γ-Al{sub 2}O{sub 3} structure. The overall findings provided an insight into the complex nanostructure, which is intrinsic to the metastable γ-Al{sub 2}O{sub 3} oxide. - Highlights: • Thin plate-like crystallites of γ-Al{sub 2}O{sub 3} were obtained. • Models of 3D coherent nanostructure of γ-Al{sub 2}O{sub 3} were constructed. • Models were verified by simulating XRD patterns using the Debye Scattering Equation. • Specific broadening of XRD peaks was explained in terms of planar defects. • Primary crystalline blocks in γ-Al{sub 2}O{sub 3} are separated by partially coherent interfaces.

A Medipix quantum area detector allows rotation electron diffraction data collection from submicrometre three-dimensional protein crystals

International Nuclear Information System (INIS)

Nederlof, Igor; Genderen, Eric van; Li, Yao-Wang; Abrahams, Jan Pieter

2013-01-01

An ultrasensitive Medipix2 detector allowed the collection of rotation electron-diffraction data from single three-dimensional protein nanocrystals for the first time. The data could be analysed using the standard X-ray crystallography programs MOSFLM and SCALA. When protein crystals are submicrometre-sized, X-ray radiation damage precludes conventional diffraction data collection. For crystals that are of the order of 100 nm in size, at best only single-shot diffraction patterns can be collected and rotation data collection has not been possible, irrespective of the diffraction technique used. Here, it is shown that at a very low electron dose (at most 0.1 e − Å −2 ), a Medipix2 quantum area detector is sufficiently sensitive to allow the collection of a 30-frame rotation series of 200 keV electron-diffraction data from a single ∼100 nm thick protein crystal. A highly parallel 200 keV electron beam (λ = 0.025 Å) allowed observation of the curvature of the Ewald sphere at low resolution, indicating a combined mosaic spread/beam divergence of at most 0.4°. This result shows that volumes of crystal with low mosaicity can be pinpointed in electron diffraction. It is also shown that strategies and data-analysis software (MOSFLM and SCALA) from X-ray protein crystallography can be used in principle for analysing electron-diffraction data from three-dimensional nanocrystals of proteins

AIC-based diffraction stacking for local earthquake locations at the Sumatran Fault (Indonesia)

Science.gov (United States)

Hendriyana, Andri; Bauer, Klaus; Muksin, Umar; Weber, Michael

2018-05-01

We present a new workflow for the localization of seismic events which is based on a diffraction stacking approach. In order to address the effects from complex source radiation patterns, we suggest to compute diffraction stacking from a characteristic function (CF) instead of stacking the original waveform data. A new CF, which is called in the following mAIC (modified from Akaike Information Criterion) is proposed. We demonstrate that both P- and S-wave onsets can be detected accurately. To avoid cross-talk between P and S waves due to inaccurate velocity models, we separate the P and S waves from the mAIC function by making use of polarization attributes. Then, the final image function is represented by the largest eigenvalue as a result of the covariance analysis between P- and S-image functions. Results from synthetic experiments show that the proposed diffraction stacking provides reliable results. The workflow of the diffraction stacking method was finally applied to local earthquake data from Sumatra, Indonesia. Recordings from a temporary network of 42 stations deployed for nine months around the Tarutung pull-apart basin were analysed. The seismic event locations resulting from the diffraction stacking method align along a segment of the Sumatran Fault. A more complex distribution of seismicity is imaged within and around the Tarutung basin. Two lineaments striking N-S were found in the centre of the Tarutung basin which support independent results from structural geology.

Inclusive transverse momentum distributions of charged particles in diffractive and non-diffractive photoproduction at HERA

International Nuclear Information System (INIS)

Derrick, M.; Krakauer, D.; Magill, S.

1995-03-01

Inclusive transverse momentum spectra of charged particles in photoproduction events in the laboratory pseudorapidity range -1.2 T =8 GeV using the ZEUS detector. Diffractive and non-diffractive reactions have been selected with an average γp centre of mass (c.m.) energy of =180 GeV. For diffractive reactions, the p T spectra of the photon dissociation events have been measured in two intervals of the dissociated photon mass with mean values X >=5 GeV and 10 GeV. The inclusive transverse momentum spectra fall exponentially in the low p T region. The non-diffractive data show a pronounced high p T tail departing from the exponential shape. The p T distributions are compared to lower energy photoproduction data and to hadron-hadron collisions at a similar c.m. energy. The data are also compared to the results of a next-to-leading order QCD calculation. (orig.)

Mapping 180° polar domains using electron backscatter diffraction and dynamical scattering simulations

Energy Technology Data Exchange (ETDEWEB)

Burch, Matthew J.; Fancher, Chris M.; Patala, Srikanth [Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC (United States); De Graef, Marc [Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburg, PA (United States); Dickey, Elizabeth C. [Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC (United States)

2017-02-15

A novel technique, which directly and nondestructively maps polar domains using electron backscatter diffraction (EBSD) is described and demonstrated. Through dynamical diffraction simulations and quantitative comparison to experimental EBSD patterns, the absolute orientation of a non-centrosymmetric crystal can be determined. With this information, the polar domains of a material can be mapped. The technique is demonstrated by mapping the non-ferroelastic, or 180°, ferroelectric domains in periodically poled LiNbO{sub 3} single crystals. Further, the authors demonstrate the possibility of mapping polarity using this technique in other polar materials system. - Highlights: • A novel technique to directly polar domains utilizing EBSD is demonstrated. • The technique relies on dynamical diffraction simulations of EBSD patterns. • The technique is demonstrated by mapping 180° domains in LiNbO{sub 3} single crystals. • Further application of this technique to other materials classes is discussed.

Grain orientation mapping of passivated aluminum interconnect lines with X-ray micro-diffraction

International Nuclear Information System (INIS)

Chang, C.H.; Patel, J.R.; MacDowell, A.A.; Padmore, H.A.; Thompson, A.C.

1998-01-01

A micro x-ray diffraction facility is under development at the Advanced Light Source. Spot sizes are typically about 1-microm size generated by means of grazing incidence Kirkpatrick-Baez focusing mirrors. Photon energy is either white of energy range 6--14 keV or monochromatic generated from a pair of channel cut crystals. Laue diffraction pattern from a single grain in a passivated 2-microm wide bamboo structured Aluminum interconnect line has been recorded. Acquisition times are of the order of seconds. The Laue pattern has allowed the determination of the crystallographic orientation of individual grains along the line length. The experimental and analysis procedure used is described, as is the latest grain orientation result. The impact of x-ray micro-diffraction and its possible future direction are discussed in the context of other developments in the area of electromigration, and other technological problems

Grain orientation mapping of passivated aluminum interconnect lines by x-ray micro-diffraction

International Nuclear Information System (INIS)

Chang, C. H.; Patel, J. R.; MacDowell, A. A.; Padmore, H. A.; Thompson, A. C.

1998-01-01

A micro x-ray diffraction facility is under development at the Advanced Light Source. Spot sizes are typically about 1-μm size generated by means of grazing incidence Kirkpatrick-Baez focusing mirrors. Photon energy is either white of energy range 6-14 keV or monochromatic generated from a pair of channel cut crystals. Laue diffraction pattern from a single grain in a passivated 2-μm wide bamboo structured Aluminum interconnect line has been recorded. Acquisition times are of the order of seconds. The Laue pattern has allowed the determination of the crystallographic orientation of individual grains along the line length. The experimental and analysis procedure used is described, as is the latest grain orientation result. The impact of x-ray micro-diffraction and its possible future direction are discussed in the context of other developments in the area of electromigration, and other technological problems

Structural investigation of GaInP nanowires using X-ray diffraction

DEFF Research Database (Denmark)

Kriegner, D.; Persson, Johan Mikael; Etzelstorfer, T.

2013-01-01

In this work the structure of ternary GaxIn1−xP nanowires is investigated with respect to the chemical composition and homogeneity. The nanowires were grown by metal–organic vapor-phase epitaxy. For the investigation of ensemble fluctuations on several lateral length scales, X-ray diffraction...... gradients along the sample by recording diffraction patterns at different positions. In addition, compositional variations were found also within single nanowires in X-ray energy dispersive spectroscopy measurements....

Determination of initial stages of recrystallization in aluminium alloys by X-ray diffraction

International Nuclear Information System (INIS)

Loew, Marjorie

2000-01-01

Aluminium is a metal with a wide variety of application, such as beer cans, pans, door and window borders, and others more advanced, such as airplane structure, car engines, nuclear reactors components, rocket propulsion components and so on. Most of aluminium application is in alloy form. Such alloys must present suitable mechanical and chemical properties that are obtained, not entirely, by microstructure development. In this work, the beginning of recrystallization processes of AA1050 and AA3003 aluminium alloys were studied using X-ray diffraction techniques, transmission electron microscopy and hardness test. For such a sample, an initial heat treatment was done in order to homogenize the samples microstructure, followed by cold rolling and submitted again to a heat treatment in different temperatures in a hot furnace. After that samples were analyzed to verify the beginning of the recrystallization. Vickers hardness test revealed that the beginning of recrystallization is between 150 and 300 deg C for 1050 aluminium alloy and 200 and 300 deg C for 3003 aluminium alloy. X-ray diffraction using transmission chamber showed that the beginning of recrystallization is 240 and 260 deg C for AA1050 and AA3003, respectively. These temperatures were determined as the diffraction patterns recorded in the photographic plates changes when the recrystallization takes place. In this way, the deformed sample shows continuous concentric lines and the beginning of recrystallization is characterized by the occurrence of defined spots in this pattern. The Pole Figures goniometric method revealed that the beginning of recrystallization takes place between 250 and 300 deg C for both alloys. In the same way, orientation distribution functions showed the same temperature range for the recrystallization. However, the analysis by α and β fiber figures, the recrystallization temperatures are 240 and 260 deg C for AA1050 and AA3003, respectively. Finally, after the analysis of all

Controlled molecules for X-ray diffraction experiments at free-electron lasers

International Nuclear Information System (INIS)

Stern, Stephan

2013-12-01

performed on a gas-phase ensemble of the prototypical molecule 2,5-diiodobenzonitrile (C 7 H 3 I 2 N, DIBN) at the X-ray free-electron laser LCLS. The target molecules were laser-aligned along a common axis in the laboratory frame by a Nd:YAG laser. Reaching a strong degree of molecular alignment, was an important step in this experiment. Therefore, a significant part of the work was dedicated to gaining control of the molecular degrees of freedom. In order to reach a high degree of alignment, the target molecules were prepared in low rotational quantum states by means of efficient cooling in a supersonic expansion from a pulsed valve followed by spatial quantum-state selection in an electrostatic deflector. Utilization of the deflector significantly improved alignment of the DIBN molecules. Further applications of the deection technique such as, e.g., the spatial separation of several species of molecular complexes/clusters are presented in this thesis as well. The quantum-state selected and strongly laser-aligned samples were probed by the X-ray pulses of LCLS and the obtained diffraction patterns show a significant difference when comparing diffraction from aligned and isotropically-distributed DIBN which agrees well with theory. The results represent an important step in the effort of pushing diffractive imaging of non-crystalline samples at XFELs towards the single-molecule limit. Concepts and experimental requirements for future experiments of this kind are discussed, involving, e.g., the step towards imaging of laser-aligned large (bio)macromolecules or imaging of ultrafast fragmentation dynamics in femtosecond pump-probe experiments at XFELs.

Controlled molecules for X-ray diffraction experiments at free-electron lasers

Energy Technology Data Exchange (ETDEWEB)

Stern, Stephan

2013-12-15

performed on a gas-phase ensemble of the prototypical molecule 2,5-diiodobenzonitrile (C{sub 7}H{sub 3}I{sub 2}N, DIBN) at the X-ray free-electron laser LCLS. The target molecules were laser-aligned along a common axis in the laboratory frame by a Nd:YAG laser. Reaching a strong degree of molecular alignment, was an important step in this experiment. Therefore, a significant part of the work was dedicated to gaining control of the molecular degrees of freedom. In order to reach a high degree of alignment, the target molecules were prepared in low rotational quantum states by means of efficient cooling in a supersonic expansion from a pulsed valve followed by spatial quantum-state selection in an electrostatic deflector. Utilization of the deflector significantly improved alignment of the DIBN molecules. Further applications of the deection technique such as, e.g., the spatial separation of several species of molecular complexes/clusters are presented in this thesis as well. The quantum-state selected and strongly laser-aligned samples were probed by the X-ray pulses of LCLS and the obtained diffraction patterns show a significant difference when comparing diffraction from aligned and isotropically-distributed DIBN which agrees well with theory. The results represent an important step in the effort of pushing diffractive imaging of non-crystalline samples at XFELs towards the single-molecule limit. Concepts and experimental requirements for future experiments of this kind are discussed, involving, e.g., the step towards imaging of laser-aligned large (bio)macromolecules or imaging of ultrafast fragmentation dynamics in femtosecond pump-probe experiments at XFELs.

On the evaluation of X-ray diffraction experiments by the regularization method

Energy Technology Data Exchange (ETDEWEB)

Trubin, V.A.; Szasz, A. (Lab. of Surface and Interface Physics, Eoetvoes Univ., Budapest (Hungary))

1991-05-16

The characteristic property of diffractometers as the presence of occasional and systematic errors in measured patterns requires such an evaluation which is as informative as possible. This circumstance gives rise to the problem of optimal planning of the experiment. The X-ray diffraction optimization problem with application of the regularization method is studied. The proposal permits to determine more accurately the unknown true characteristics of the X-ray diffraction experiment. (orig.).

On the evaluation of X-ray diffraction experiments by the regularization method

International Nuclear Information System (INIS)

Trubin, V.A.; Szasz, A.

1991-01-01

The characteristic property of diffractometers as the presence of occasional and systematic errors in measured patterns requires such an evaluation which is as informative as possible. This circumstance gives rise to the problem of optimal planning of the experiment. The X-ray diffraction optimization problem with application of the regularization method is studied. The proposal permits to determine more accurately the unknown true characteristics of the X-ray diffraction experiment. (orig.)

X-ray diffraction characteristics of curved monochromators for sychrotron radiation

International Nuclear Information System (INIS)

Boeuf, A.; Rustichelli, F.; Mazkedian, S.; Puliti, P.; Melone, S.

1978-01-01

A theoretical study is presented concerning the diffraction characteristics of curved monochromators for X-ray synchrotron radiation used at the laboratories of Hamburg, Orsay and Stanford. The investigation was performed by extending to the X-ray case a simple model recently developed and fruitfully employed to describe the neutron diffraction properties of curved monochromators. Several diffraction patterns were obtained corresponding to different monochromator materials (Ge, Si) used by the different laboratories, for different reflecting planes (111), (220), asymmetry angles, X-ray wave-lengths (Mo Kα, Cu Kα, Cr Kα) and curvature radii. The results are discussed in physical terms and their implications on the design of curved monochromators for synchrotron radiation are presented. In particular, the study shows that all the monochromators used in the different laboratories should behave practically as perfect crystals and therefore should have a very low integrated reflectivity corresponding to an optimized wavelength passband Δlambda/lambda approximately 10 -4 . The gain that can be obtained by increasing the curvature, by introducing a gradient in the lattice spacing or by any other kind of imperfection is quite limited and much lower than the desirable value. The adopted model can help in obtaining a possible moderate gain in intensity by also taking into consideration other parameters, such as crystal material, reflecting plane, asymmetry of the reflection and X-ray wavelength. (Auth.)

Fungal communities in wheat grain show significant co-existence patterns among species

DEFF Research Database (Denmark)

Nicolaisen, M.; Justesen, A. F.; Knorr, K.

2014-01-01

identified as ‘core’ OTUs as they were found in all or almost all samples and accounted for almost 99 % of all sequences. The remaining OTUs were only sporadically found and only in small amounts. Cluster and factor analyses showed patterns of co-existence among the core species. Cluster analysis grouped...... the 21 core OTUs into three clusters: cluster 1 consisting of saprotrophs, cluster 2 consisting mainly of yeasts and saprotrophs and cluster 3 consisting of wheat pathogens. Principal component extraction showed that the Fusarium graminearum group was inversely related to OTUs of clusters 1 and 2....

Genomic patterns in Acropora cervicornis show extensive population structure and variable genetic diversity.

Science.gov (United States)

Drury, Crawford; Schopmeyer, Stephanie; Goergen, Elizabeth; Bartels, Erich; Nedimyer, Ken; Johnson, Meaghan; Maxwell, Kerry; Galvan, Victor; Manfrino, Carrie; Lirman, Diego

2017-08-01

Threatened Caribbean coral communities can benefit from high-resolution genetic data used to inform management and conservation action. We use Genotyping by Sequencing (GBS) to investigate genetic patterns in the threatened coral, Acropora cervicornis , across the Florida Reef Tract (FRT) and the western Caribbean. Results show extensive population structure at regional scales and resolve previously unknown structure within the FRT. Different regions also exhibit up to threefold differences in genetic diversity (He), suggesting targeted management based on the goals and resources of each population is needed. Patterns of genetic diversity have a strong spatial component, and our results show Broward and the Lower Keys are among the most diverse populations in Florida. The genetic diversity of Caribbean staghorn coral is concentrated within populations and within individual reefs (AMOVA), highlighting the complex mosaic of population structure. This variance structure is similar over regional and local scales, which suggests that in situ nurseries are adequately capturing natural patterns of diversity, representing a resource that can replicate the average diversity of wild assemblages, serving to increase intraspecific diversity and potentially leading to improved biodiversity and ecosystem function. Results presented here can be translated into specific goals for the recovery of A. cervicornis , including active focus on low diversity areas, protection of high diversity and connectivity, and practical thresholds for responsible restoration.

Crystallization and preliminary X-ray diffraction analysis of West Nile virus

International Nuclear Information System (INIS)

Kaufmann, Bärbel; Plevka, Pavel; Kuhn, Richard J.; Rossmann, Michael G.

2010-01-01

Crystals of infectious West Nile virus were obtained and diffracted at best to about 25 Å resolution. Preliminary analysis of the diffraction pattern suggested tight hexagonal packing of the intact virus. West Nile virus, a human pathogen, is closely related to other medically important flaviviruses of global impact such as dengue virus. The infectious virus was purified from cell culture using polyethylene glycol (PEG) precipitation and density-gradient centrifugation. Thin amorphously shaped crystals of the lipid-enveloped virus were grown in quartz capillaries equilibrated by vapor diffusion. Crystal diffraction extended at best to a resolution of about 25 Å using synchrotron radiation. A preliminary analysis of the diffraction images indicated that the crystals had unit-cell parameters a ≃ b ≃ 480 Å, γ = 120°, suggesting a tight hexagonal packing of one virus particle per unit cell

Digital Image Correlation of 2D X-ray Powder Diffraction Data for Lattice Strain Evaluation

Science.gov (United States)

Zhang, Hongjia; Sui, Tan; Daisenberger, Dominik; Fong, Kai Soon

2018-01-01

High energy 2D X-ray powder diffraction experiments are widely used for lattice strain measurement. The 2D to 1D conversion of diffraction patterns is a necessary step used to prepare the data for full pattern refinement, but is inefficient when only peak centre position information is required for lattice strain evaluation. The multi-step conversion process is likely to lead to increased errors associated with the ‘caking’ (radial binning) or fitting procedures. A new method is proposed here that relies on direct Digital Image Correlation analysis of 2D X-ray powder diffraction patterns (XRD-DIC, for short). As an example of using XRD-DIC, residual strain values along the central line in a Mg AZ31B alloy bar after 3-point bending are calculated by using both XRD-DIC and the conventional ‘caking’ with fitting procedures. Comparison of the results for strain values in different azimuthal angles demonstrates excellent agreement between the two methods. The principal strains and directions are calculated using multiple direction strain data, leading to full in-plane strain evaluation. It is therefore concluded that XRD-DIC provides a reliable and robust method for strain evaluation from 2D powder diffraction data. The XRD-DIC approach simplifies the analysis process by skipping 2D to 1D conversion, and opens new possibilities for robust 2D powder diffraction data analysis for full in-plane strain evaluation. PMID:29543728

Digital Image Correlation of 2D X-ray Powder Diffraction Data for Lattice Strain Evaluation

Directory of Open Access Journals (Sweden)

Hongjia Zhang

2018-03-01

Full Text Available High energy 2D X-ray powder diffraction experiments are widely used for lattice strain measurement. The 2D to 1D conversion of diffraction patterns is a necessary step used to prepare the data for full pattern refinement, but is inefficient when only peak centre position information is required for lattice strain evaluation. The multi-step conversion process is likely to lead to increased errors associated with the ‘caking’ (radial binning or fitting procedures. A new method is proposed here that relies on direct Digital Image Correlation analysis of 2D X-ray powder diffraction patterns (XRD-DIC, for short. As an example of using XRD-DIC, residual strain values along the central line in a Mg AZ31B alloy bar after 3-point bending are calculated by using both XRD-DIC and the conventional ‘caking’ with fitting procedures. Comparison of the results for strain values in different azimuthal angles demonstrates excellent agreement between the two methods. The principal strains and directions are calculated using multiple direction strain data, leading to full in-plane strain evaluation. It is therefore concluded that XRD-DIC provides a reliable and robust method for strain evaluation from 2D powder diffraction data. The XRD-DIC approach simplifies the analysis process by skipping 2D to 1D conversion, and opens new possibilities for robust 2D powder diffraction data analysis for full in-plane strain evaluation.

Photoelectron diffraction and holography: Present status and future prospects

Energy Technology Data Exchange (ETDEWEB)

Fadley, C.S. [California Univ., Davis, CA (United States). Dept. of Physics]|[Lawrence Berkeley Lab., CA (United States); Thevuthasan, S. [California Univ., Davis, CA (United States). Dept. of Physics; Kaduwela, A.P. [Lawrence Berkeley Lab., CA (United States)] [and others

1993-07-01

Photoelectron diffraction and photoelectron holography, a newly developed variant of it, can provide a rich range of information concerning surface structure. These methods are sensitive to atomic type, chemical state, and spin state. The theoretical prediction of diffraction patterns is also well developed at both the single scattering and multiple scattering levels, and quantitative fits of experiment to theory can lead to structures with accuracies in the {plus_minus}0.03 {Angstrom} range. Direct structural information can also be derived from forward scattering in scanned-angle measurements at higher energies, path length differences contained in scanned-energy data at lower energies, and holographic inversions of data sets spanning some region in angle and energy space. Diffraction can also affect average photoelectron emission depths. Circular dichroism in core-level emission can be fruitfully interpreted in terms of photoelectron diffraction theory, as can measurements with spin-resolved core-spectra, and studies of surface magnetic structures and phase transitions should be possible with these methods. Synchrotron radiation is a key element of fully utilizing these techniques.

Highlighting material structure with transmission electron diffraction correlation coefficient maps

International Nuclear Information System (INIS)

Kiss, Ákos K.; Rauch, Edgar F.; Lábár, János L.

2016-01-01

Correlation coefficient maps are constructed by computing the differences between neighboring diffraction patterns collected in a transmission electron microscope in scanning mode. The maps are shown to highlight material structural features like grain boundaries, second phase particles or dislocations. The inclination of the inner crystal interfaces are directly deduced from the resulting contrast. - Highlights: • We propose a novel technique to image the structure of polycrystalline TEM-samples. • Correlation coefficients maps highlights the evolution of the diffracting signal. • 3D views of grain boundaries are provided for nano-particles or polycrystals.

Electro-optic sampling for time resolving relativistic ultrafast electron diffraction

International Nuclear Information System (INIS)

Scoby, C. M.; Musumeci, P.; Moody, J.; Gutierrez, M.; Tran, T.

2009-01-01

The Pegasus laboratory at UCLA features a state-of-the-art electron photoinjector capable of producing ultrashort (<100 fs) high-brightness electron bunches at energies of 3.75 MeV. These beams recently have been used to produce static diffraction patterns from scattering off thin metal foils, and it is foreseen to take advantage of the ultrashort nature of these bunches in future pump-probe time-resolved diffraction studies. In this paper, single shot 2-d electro-optic sampling is presented as a potential technique for time of arrival stamping of electron bunches used for diffraction. Effects of relatively low bunch charge (a few 10's of pC) and modestly relativistic beams are discussed and background compensation techniques to obtain high signal-to-noise ratio are explored. From these preliminary tests, electro-optic sampling is suitable to be a reliable nondestructive time stamping method for relativistic ultrafast electron diffraction at the Pegasus lab.

Study of the ferrimagnetic and paramagnetic phases of magnetite measured by multiple neutron diffraction

International Nuclear Information System (INIS)

Mazzocchi, V.L.

1992-01-01

Structural parameters of the ferrimagnetic and paramagnetic phases of magnetite have been refined from neutron multiple diffraction data. Experimental multiple diffraction patterns used in the refinement, were obtained by measuring the 111 primary reflection of a natural single crystal of this compound, at room temperature for the ferrimagnetic phase and 703 0 C for the paramagnetic phase. Corresponding theoretical patterns for both phases have been calculated by the program MULTI which uses the iterative method for the intensity calculations in neutron multiple diffraction. In this method intensities are calculated as Taylor series expansions summed up to a order sufficient for a good approximation. A step by step process has been used in the refinements according to the parameter-shift method. Both isotropic and anisotropic thermal parameters were used in the calculation of the temperature factor. (author)

High-pressure X-ray diffraction studies of potassium chlorate

Energy Technology Data Exchange (ETDEWEB)

Pravica, Michael; Bai, Ligang; Bhattacharya, Neelanjan (UNLV)

2012-03-15

Two static high-pressure X-ray diffraction (XRD) studies of potassium chlorate have been performed at pressures of up to {approx}14.3 GPa in a diamond anvil cell at ambient temperature using the 16 ID-B undulator beamline at the Advanced Photon Source for the X-ray source. The first experiment was conducted to ascertain decomposition rates of potassium chlorate as a function of pressure. Below 2 GPa, the sample was observed to decompose rapidly in the presence of the X-ray beam and release oxygen. Above 2 GPa (near the phase I phase II transition), the decomposition rate dramatically slowed so that good quality XRD patterns could be acquired. This suggests a phase-dependent decomposition rate. In the second study, X-ray diffraction spectra were collected at pressures from 2 to 14.3 GPa by aligning virgin portions of the sample into the focused X-ray beam at each pressure. The results suggest the co-existence of mixed monoclinic (I) and rhombohedral (II) phases of potassium chlorate near 2 GPa. At pressures beyond 4 GPa, the XRD patterns show a very good fit to KClO{sub 3} in the rhombohedral phase with space group R3m, in agreement with earlier studies. No further phase transitions were observed with pressure. Decompression of the sample to ambient pressure indicated mixed phases I and II coupled with a small amount of synchrotron X-ray-induced decomposition product. The equation of state within this pressure regime has been determined.

Zeno dynamics in wave-packet diffraction spreading

Energy Technology Data Exchange (ETDEWEB)

Porras, Miguel A. [Departamento de Fisica Aplicada, Universidad Politecnica de Madrid, Rios Rosas 21, ES-28003 Madrid (Spain); Luis, Alfredo; Gonzalo, Isabel [Departamento de Optica, Facultad de Ciencias Fisicas, Universidad Complutense, ES-28040 Madrid (Spain); Sanz, Angel S. [Instituto de Fisica Fundamental-CSIC, Serrano 123, ES-28006 Madrid (Spain)

2011-11-15

We analyze a simple and feasible practical scheme displaying Zeno, anti-Zeno, and inverse-Zeno effects in the observation of wave-packet spreading caused by free evolution. The scheme is valid both in spatial diffraction of classical optical waves and in time diffraction of a quantum wave packet. In the optical realization, diffraction spreading is observed by placing slits between a light source and a light-power detector. We show that the occurrence of Zeno or anti-Zeno effects depends just on the frequency of observations between the source and detector. These effects are seen to be related to the diffraction mode theory in Fabry-Perot resonators.

A versatile diffractive maskless lithography for single-shot and serial microfabrication.

Science.gov (United States)

Jenness, Nathan J; Hill, Ryan T; Hucknall, Angus; Chilkoti, Ashutosh; Clark, Robert L

2010-05-24

We demonstrate a diffractive maskless lithographic system that is capable of rapidly performing both serial and single-shot micropatterning. Utilizing the diffractive properties of phase holograms displayed on a spatial light modulator, arbitrary intensity distributions were produced to form two and three dimensional micropatterns/structures in a variety of substrates. A straightforward graphical user interface was implemented to allow users to load templates and change patterning modes within the span of a few minutes. A minimum resolution of approximately 700 nm is demonstrated for both patterning modes, which compares favorably to the 232 nm resolution limit predicted by the Rayleigh criterion. The presented method is rapid and adaptable, allowing for the parallel fabrication of microstructures in photoresist as well as the fabrication of protein microstructures that retain functional activity.

Large-Scale No-Show Patterns and Distributions for Clinic Operational Research

Directory of Open Access Journals (Sweden)

Michael L. Davies

2016-02-01

Full Text Available Patient no-shows for scheduled primary care appointments are common. Unused appointment slots reduce patient quality of care, access to services and provider productivity while increasing loss to follow-up and medical costs. This paper describes patterns of no-show variation by patient age, gender, appointment age, and type of appointment request for six individual service lines in the United States Veterans Health Administration (VHA. This retrospective observational descriptive project examined 25,050,479 VHA appointments contained in individual-level records for eight years (FY07-FY14 for 555,183 patients. Multifactor analysis of variance (ANOVA was performed, with no-show rate as the dependent variable, and gender, age group, appointment age, new patient status, and service line as factors. The analyses revealed that males had higher no-show rates than females to age 65, at which point males and females exhibited similar rates. The average no-show rates decreased with age until 75–79, whereupon rates increased. As appointment age increased, males and new patients had increasing no-show rates. Younger patients are especially prone to no-show as appointment age increases. These findings provide novel information to healthcare practitioners and management scientists to more accurately characterize no-show and attendance rates and the impact of certain patient factors. Future general population data could determine whether findings from VHA data generalize to others.

Large-Scale No-Show Patterns and Distributions for Clinic Operational Research.

Science.gov (United States)

Davies, Michael L; Goffman, Rachel M; May, Jerrold H; Monte, Robert J; Rodriguez, Keri L; Tjader, Youxu C; Vargas, Dominic L

2016-02-16

Patient no-shows for scheduled primary care appointments are common. Unused appointment slots reduce patient quality of care, access to services and provider productivity while increasing loss to follow-up and medical costs. This paper describes patterns of no-show variation by patient age, gender, appointment age, and type of appointment request for six individual service lines in the United States Veterans Health Administration (VHA). This retrospective observational descriptive project examined 25,050,479 VHA appointments contained in individual-level records for eight years (FY07-FY14) for 555,183 patients. Multifactor analysis of variance (ANOVA) was performed, with no-show rate as the dependent variable, and gender, age group, appointment age, new patient status, and service line as factors. The analyses revealed that males had higher no-show rates than females to age 65, at which point males and females exhibited similar rates. The average no-show rates decreased with age until 75-79, whereupon rates increased. As appointment age increased, males and new patients had increasing no-show rates. Younger patients are especially prone to no-show as appointment age increases. These findings provide novel information to healthcare practitioners and management scientists to more accurately characterize no-show and attendance rates and the impact of certain patient factors. Future general population data could determine whether findings from VHA data generalize to others.

Extended ABCD matrix formalism for the description of femtosecond diffraction patterns; application to femtosecond digital in-line holography with anamorphic optical systems.

Science.gov (United States)

Brunel, Marc; Shen, Huanhuan; Coetmellec, Sebastien; Lebrun, Denis

2012-03-10

We present a new model to predict diffraction patterns of femtosecond pulses through complex optical systems. The model is based on the extension of an ABCD matrix formalism combined with generalized Huygens-Fresnel transforms (already used in the CW regime) to the femtosecond regime. The model is tested to describe femtosecond digital in-line holography experiments realized in situ through a cylindrical Plexiglas pipe. The model allows us to establish analytical relations that link the holographic reconstruction process to the experimental parameters of the pipe and of the incident beam itself. Simulations and experimental results are in good concordance. Femtosecond digital in-line holography is shown to allow significant coherent noise reduction, and this model will be particularly efficient to describe a wide range of optical geometries. More generally, the model developed can be easily used in any experiment where the knowledge of the precise evolution of femtosecond transverse patterns is required.

Quantification and differentiation of nuclear tracks in SSNTD by simulation of their diffraction pattern

International Nuclear Information System (INIS)

Palacios, D.; Palacios, F.; Vitoria, T.

2001-01-01

An alternative method to count and differentiate nuclear tracks in SSNTD is described. The method is based on the simulation and analysis of Fraunhofer diffraction pattern formed when coherent light passes through tracks of an etched detector. Transformation of the optical system was carried out by a digital procedure of Fourier Transform. Spectral analysis of the radial intensity distribution facilitated to quantify and differentiate tracks for its diameters. The formalism outlined is also applicable to elliptic tracks. Different components of the developed software (TRACKS) are shown. Results obtained by simulation and by the theoretical model gave satisfactory concordance. With the purpose of optimizing the proposed method, technical variants of optic microscopy are discussed. A model that considers the correction for track overlapping was developed and applied. Count error is small when track distribution changes in the field of view. The proposed method can differentiate genuine tracks from defects and anomalies of the detector. Analyzing the influence of illumination conditions and focus of the microscope on track counting and discrimination, the preliminary treatment of images obtained by the CCD camera was established. The proposed method allows, with low cost and operation simplicity, guaranteeing high speed in the obtaining of results, to calculate with good approximation track density in CR-39 detectors and to differentiate the energy of incident ions by track diameters with satisfactory accuracy and precision

Micro-channel plate detector for ultra-fast relativistic electron diffraction

International Nuclear Information System (INIS)

Musumeci, P.; Moody, J.T.; Scoby, C.M.; Gutierrez, M.S.; Bender, H.A.; Hilko, B.; Kruschwitz, C.A.; Wilcox, N.S.

2011-01-01

Using relativistic ultra-short electron beams to obtain single-shot diffraction patterns holds the promise to yield real-time resolution of atomic motion in an easily accessible environment, such as a university laboratory, at a fraction of the cost of fourth-generation X-ray sources. One of the main issues in bringing this technique to full maturity is the development of efficient detector systems to record the diffraction pattern using a few MeV electron beams. Low noise, high spatial resolution, and single-electron detection capability are all characteristics of an ideal detector. In this paper, we compare the performances of a traditional fluorescent phosphor screen with a detection system based on the micro-channel plate (MCP). Since MCPs are typically used with lower energy electron beams, these tests constitute one of the few experimental data points available on the use of these devices with MeV energy beams.

Micro-channel plate detector for ultra-fast relativistic electron diffraction

Energy Technology Data Exchange (ETDEWEB)

Musumeci, P., E-mail: musumeci@physics.ucla.edu [UCLA Department of Physics and Astronomy, 475 Portola Plaza, Los Angeles, CA, 90095-1547 (United States); Moody, J.T.; Scoby, C.M.; Gutierrez, M.S. [UCLA Department of Physics and Astronomy, 475 Portola Plaza, Los Angeles, CA, 90095-1547 (United States); Bender, H.A.; Hilko, B.; Kruschwitz, C.A.; Wilcox, N.S. [National Security Technologies, LLC, Los Alamos Operations, Los Alamos, NM (United States)

2011-05-01

Using relativistic ultra-short electron beams to obtain single-shot diffraction patterns holds the promise to yield real-time resolution of atomic motion in an easily accessible environment, such as a university laboratory, at a fraction of the cost of fourth-generation X-ray sources. One of the main issues in bringing this technique to full maturity is the development of efficient detector systems to record the diffraction pattern using a few MeV electron beams. Low noise, high spatial resolution, and single-electron detection capability are all characteristics of an ideal detector. In this paper, we compare the performances of a traditional fluorescent phosphor screen with a detection system based on the micro-channel plate (MCP). Since MCPs are typically used with lower energy electron beams, these tests constitute one of the few experimental data points available on the use of these devices with MeV energy beams.

Diffractive optical elements written by photodeposition

International Nuclear Information System (INIS)

Baal-Zedaka, I.; Hava, S.; Mirchin, N.; Margolin, R.; Zagon, M.; Lapsker, I.; Azoulay, J.; Peled, A.

2003-01-01

In this work direct laser writing of diffractive optical elements (DOE) by photodeposition (PD) of amorphous selenium (a-Se) from colloid solutions has been investigated. We used a computer controlled laser scanner for patterning thin film micro-profiles creating thus planar optical elements by direct beam writing on surfaces immersed in a liquid phase PD cell. The laser employed was an argon ion laser at 488 nm wavelength, with powers up to 55 mW, for writing typically 25-250 μm wide lines of 200 nm thickness at rates of about 150 μm/s. Various elements made of photodeposited thin films on polymethyl-methacrylate (PMMA) substrates were produced for prototyping microlenses, linear grating arrays, cylindrical and circular profiled DOE patterns

ESR and X-ray diffraction studies on thin films of poly-3-hexylthiophene: Molecular orientation and magnetic interactions

International Nuclear Information System (INIS)

Sugiyama, Keisuke; Kojima, Takashi; Fukuda, Hisashi; Yashiro, Hisashi; Matsuura, Toshihiko; Shimoyama, Yuhei

2008-01-01

Poly-3-hexylthiophene (P3HT) thin films were investigated by X-ray diffraction (XRD) and electron spin resonance (ESR) to reveal the film structure and molecular organization. The XRD data showed a diffraction pattern with a plane separation between the planes containing thiophene rings of 16.0 A. Comparison between the XRD patterns of powder and thin films of P3HT suggests that the main chains are folded on the substrate. Angular variation of the line position (g-value) of ESR spectra revealed that thiophene ring of P3HT orients along the substrate normal axis. The ESR linewidth varied by the angular rotation, indicating the one-dimensional spin-chain interactions in the P3HT thin films with a linear network of spin-chains. An organic thin-film transistor (OTFT) with P3HT film as a channel layer was then demonstrated. The P3HT films showed conducting characteristics with holes as carriers. The OTFTs indicated a field-effect mobility of 4.93 x 10 -3 cm 2 /Vs and an on/off ratio of 73 in the accumulation mode

Precise rotational alignment of x-ray transmission diffraction gratings

International Nuclear Information System (INIS)

Hill, S.L.

1988-01-01

Gold transmission diffraction gratings used for x-ray spectroscopy must sometimes be rotationally aligned to the axis of a diagnostic instrument to within sub-milliradian accuracy. We have fabricated transmission diffraction gratings with high line-densities (grating period of 200 and 300 nm) using uv holographic and x-ray lithography. Since the submicron features of the gratings are not optically visible, precision alignment is time consuming and difficult to verify in situ. We have developed a technique to write an optically visible alignment pattern onto these gratings using a scanning electron microscope (SEM). At high magnification (15000 X) several submicron lines of the grating are observable in the SEM, making it possible to write an alignment pattern parallel to the grating lines in an electron-beam-sensitive coating that overlays the grating. We create an alignment pattern by following a 1-cm-long grating line using the SEM's joystick-controlled translation stage. By following the same grating line we are assured the traveled direction of the SEM electron beam is parallel to the grating to better than 10 μradian. The electron-beam-exposed line-width can be large (5 to 15 μm wide) depending on the SEM magnification, and is therefore optically visible. The exposed pattern is eventually made a permanent feature of the grating by ion beam etching or gold electroplating. The pattern can be used to accurately align the grating to the axis of a diagnostic instrument. More importantly, the alignment of the grating can be quickly verified in situ

Developments in diffraction databases

International Nuclear Information System (INIS)

Jenkins, R.

1999-01-01

Full text: There are a number of databases available to the diffraction community. Two of the more important of these are the Powder Diffraction File (PDF) maintained by the International Centre for Diffraction Data (ICDD), and the Inorganic Crystal Structure Database (ICSD) maintained by Fachsinformationzentrum (FIZ, Karlsruhe). In application, the PDF has been used as an indispensable tool in phase identification and identification of unknowns. The ICSD database has extensive and explicit reference to the structures of compounds: atomic coordinates, space group and even thermal vibration parameters. A similar database, but for organic compounds, is maintained by the Cambridge Crystallographic Data Centre. These databases are often used as independent sources of information. However, little thought has been given on how to exploit the combined properties of structural database tools. A recently completed agreement between ICDD and FIZ, plus ICDD and Cambridge, provides a first step in complementary use of the PDF and the ICSD databases. The focus of this paper (as indicated below) is to examine ways of exploiting the combined properties of both databases. In 1996, there were approximately 76,000 entries in the PDF and approximately 43,000 entries in the ICSD database. The ICSD database has now been used to calculate entries in the PDF. Thus, to derive d-spacing and peak intensity data requires the synthesis of full diffraction patterns, i.e., we use the structural data in the ICSD database and then add instrumental resolution information. The combined data from PDF and ICSD can be effectively used in many ways. For example, we can calculate PDF data for an ideally random crystal distribution and also in the absence of preferred orientation. Again, we can use systematic studies of intermediate members in solid solutions series to help produce reliable quantitative phase analyses. In some cases, we can study how solid solution properties vary with composition and

A Medipix quantum area detector allows rotation electron diffraction data collection from submicrometre three-dimensional protein crystals

Energy Technology Data Exchange (ETDEWEB)

Nederlof, Igor; Genderen, Eric van; Li, Yao-Wang; Abrahams, Jan Pieter, E-mail: abrahams@chem.leidenuniv.nl [Leiden University, Einsteinweg 55, 2333 CC Leiden (Netherlands)

2013-07-01

An ultrasensitive Medipix2 detector allowed the collection of rotation electron-diffraction data from single three-dimensional protein nanocrystals for the first time. The data could be analysed using the standard X-ray crystallography programs MOSFLM and SCALA. When protein crystals are submicrometre-sized, X-ray radiation damage precludes conventional diffraction data collection. For crystals that are of the order of 100 nm in size, at best only single-shot diffraction patterns can be collected and rotation data collection has not been possible, irrespective of the diffraction technique used. Here, it is shown that at a very low electron dose (at most 0.1 e{sup −} Å{sup −2}), a Medipix2 quantum area detector is sufficiently sensitive to allow the collection of a 30-frame rotation series of 200 keV electron-diffraction data from a single ∼100 nm thick protein crystal. A highly parallel 200 keV electron beam (λ = 0.025 Å) allowed observation of the curvature of the Ewald sphere at low resolution, indicating a combined mosaic spread/beam divergence of at most 0.4°. This result shows that volumes of crystal with low mosaicity can be pinpointed in electron diffraction. It is also shown that strategies and data-analysis software (MOSFLM and SCALA) from X-ray protein crystallography can be used in principle for analysing electron-diffraction data from three-dimensional nanocrystals of proteins.

Effect of environmental temperature on diffraction efficiency for multilayer diffractive optical elements in Mid-wave infrared

Science.gov (United States)

Piao, Mingxu; Cui, Qingfeng; Zhu, Hao; Zhang, Bo

2014-11-01

In this paper, the effect of environmental temperature change on multilayer diffractive optical elements (MLDOEs) is evaluated from the viewpoint of the diffraction efficiency and the polychromatic integral diffraction efficiency (PIDE). As environmental temperature changes, the microstructure heights of MLDOEs expand or contract, and refractive indices of substrate materials also change. Based on the changes in microstructure height and substrate material index with environmental temperature, the theoretical relation between diffraction efficiency of MLDOEs and environmental temperature is deduced. A practical 3-5μm Mid-wave infrared (MWIR) optical system designed with a MLDOE, which made of ZNSE and GE, is discussed to illustrate the influence of environmental temperature change. The result shows that diffraction efficiency reduction is no more than 85% and PIDE reduction is less than 50% when environmental temperature ranges from -20°C to 60°C. According to the calculated diffraction efficiency in different environmental temperatures, the MTF of hybrid optical system is modified and the modified MTF curve is compared with the original MTF curve. Although the hybrid optical system achieved passive athermalization in above environmental temperature range, the modified MTF curve also remarkably decline in environmental temperature extremes after the consideration of diffraction efficiency change of MLDOE. It is indicated that the image quality of hybrid optical system with ZNSE-GE MLDOE is significantly sensitive to environmental temperature change. The analysis result can be used for optical engineering design with MLDOEs in MWIR.

New software to model energy dispersive X-ray diffraction in polycrystalline materials

Energy Technology Data Exchange (ETDEWEB)

Ghammraoui, B., E-mail: bahaa.ghammraoui@cea.fr [CEA-Leti, MINATEC Campus, 17 rue des Martyrs, F 38054 Grenoble, Cedex 9 (France); Tabary, J. [CEA-Leti, MINATEC Campus, 17 rue des Martyrs, F 38054 Grenoble, Cedex 9 (France); Pouget, S. [CEA-INAC Sciences de la matieres, 17 rue des Martyrs, F 38054 Grenoble, Cedex 9 (France); Paulus, C.; Moulin, V.; Verger, L. [CEA-Leti, MINATEC Campus, 17 rue des Martyrs, F 38054 Grenoble, Cedex 9 (France); Duvauchelle, Ph. [CNDRI-Insa Lyon, Universite de Lyon, F-69621, Villeurbanne Cedex (France)

2012-02-01

Detection of illicit materials, such as explosives or drugs, within mixed samples is a major issue, both for general security and as part of forensic analyses. In this paper, we describe a new code simulating energy dispersive X-ray diffraction patterns in polycrystalline materials. This program, SinFullscat, models diffraction of any object in any diffractometer system taking all physical phenomena, including amorphous background, into account. Many system parameters can be tuned: geometry, collimators (slit and cylindrical), sample properties, X-ray source and detector energy resolution. Good agreement between simulations and experimental data was obtained. Simulations using explosive materials indicated that parameters such as the diffraction angle or the energy resolution of the detector have a significant impact on the diffraction signature of the material inspected. This software will be a convenient tool to test many diffractometer configurations, providing information on the one that best restores the spectral diffraction signature of the materials of interest.

A scattering approach to sea wave diffraction

Energy Technology Data Exchange (ETDEWEB)

Corradini, M. L., E-mail: letizia.corradini@unicam.it; Garbuglia, M., E-mail: milena.garbuglia@unicam.it; Maponi, P., E-mail: pierluigi.maponi@unicam.it [University of Camerino, via Madonna delle Carceri, 9, 62032, Camerino (Italy); Ruggeri, M., E-mail: ru.marco@faggiolatipumps.it [Faggiolati Pumps S.p.A., Z.Ind Sforzacosta, 62100, Macerata (Italy)

2016-06-08

This paper intends to show a model for the diffraction of sea waves approaching an OWC device, which converts the sea waves motion into mechanical energy and then electrical energy. This is a preliminary study to the optimisation of the device, in fact the computation of sea waves diffraction around the device allows the estimation of the sea waves energy which enters into the device. The computation of the diffraction phenomenon is the result of a sea waves scattering problem, solved with an integral equation method.

Deep-inelastic electron-proton diffraction

International Nuclear Information System (INIS)

Dainton, J.B.

1995-11-01

Recent measurements by the H1 collaboration at HERA of the cross section for deep-inelastic electron-proton scattering in which the proton interacts with minimal energy transfer and limited 4-momentum transfer squared are presented in the form of the contribution F 2 D(3) to the proton structure function F 2 . By parametrising the cross section phenomenologically in terms of a leading effective Regge pole exchange and comparing the result with a similar parametrisation of hadronic pp physics, the proton interaction is demonstrated to be dominantly of a diffractive nature. The quantitative interpretation of the parametrisation in terms of the properties of an effective leading Regge pole exchange, the pomeron (IP), shows that there is no evidence for a 'harder' BFKL-motivated IP in such deep-inelastic proton diffraction. The total contribution of proton diffraction to deep-inelastic electron-proton scattering is measured to be ∝10% and to be rather insensitive to Bjorken-x and Q 2 . A first measurement of the partonic structure of diffractive exchange is presented. It is shown to be readily interpreted in terms of the exchange of gluons, and to suggest that the bulk of diffractive momentum transfer is carried by a leading gluon. (orig.)

Advances in X-ray powder diffraction profile analysis and its application in ceramic material studies

International Nuclear Information System (INIS)

Zhang, Y.

1988-01-01

This dissertation is concerned with the following major aspects: (1) the development of necessary computer codes to carry out X-ray powder diffraction profile analysis (XPDPA) calculations; (2) the establishment of a general reference material (GRM) which greatly extends the application of XPDPA and the study of the application of the GRM in profile analysis; (3) the determination of the coherent diffracting domain size and the lattice residual microstrain for some shock-modified and jet-milled materials. A computer code for diffraction profile refinement, XRAYL, fits a diffraction profile with any one of five mathematical functions, either as symmetric or asymmetric (split mode) forms. The resulting patterns meet the requirements for successful profile analysis of microstrain and crystallite size. Powder diffraction profile analysis requires an instrument calibration standard to correct data for instrumental profiles due to the system optics. A general reference material, LaB 6 , has been established. The pattern of this LaB 6 powder can be used to generate a reference pattern for any other substance. Through three applications, it has been shown that this LaB 6 sample can be used to remove the instrumental broadenings and gives reasonable size and strain estimates in the profile analysis of other materials. Many previous studies have shown that the solid state reactivity and physical properties of some ceramic materials can be substantially enhanced. XPDPA techniques have been used to study the plastic deformation and the reduction of crystallite size for eight shock-modified ceramic materials. The size and strain values of these materials are correlated with shock parameters

Reciprocal space mapping by spot profile analyzing low energy electron diffraction

International Nuclear Information System (INIS)

Meyer zu Heringdorf, Frank-J.; Horn-von Hoegen, Michael

2005-01-01

We present an experimental approach for the recording of two-dimensional reciprocal space maps using spot profile analyzing low energy electron diffraction (SPA-LEED). A specialized alignment procedure eliminates the shifting of LEED patterns on the screen which is commonly observed upon variation of the electron energy. After the alignment, a set of one-dimensional sections through the diffraction pattern is recorded at different energies. A freely available software tool is used to assemble the sections into a reciprocal space map. The necessary modifications of the Burr-Brown computer interface of the two Leybold and Omicron type SPA-LEED instruments are discussed and step-by-step instructions are given to adapt the SPA 4.1d software to the changed hardware. Au induced faceting of 4 deg. vicinal Si(001) is used as an example to demonstrate the technique

Diffractive optics and nanophotonics resolution below the diffraction limit

CERN Document Server

Minin, Igor

2016-01-01

In this book the authors present several examples of techniques used to overcome the Abby diffraction limit using flat and 3D diffractive optical elements, photonic crystal lenses, photonic jets, and surface plasmon diffractive optics. The structures discussed can be used in the microwave and THz range and also as scaled models for optical frequencies. Such nano-optical microlenses can be integrated, for example, into existing semiconductor heterostructure platforms for next-generation optoelectronic applications. Chapter 1 considers flat diffractive lenses and innovative 3D radiating structures including a conical millimeter-wave Fresnel zone plate (FZP) lens proposed for subwavelength focusing. In chapter 2 the subwavelength focusing properties of diffractive photonic crystal lenses are considered and it is shown that at least three different types of photonic crystal lens are possible.  With the aim of achieving subwavelength focusing, in chapter 3 an alternative mechanism to produce photonic jets at Tera...

Towards a full retrieval of the deformation tensor F using convergent beam electron diffraction

Energy Technology Data Exchange (ETDEWEB)

Martin, Y. [CEA, INAC-SP2M, LEMMA, F-38000 Grenoble (France); Univ. Grenoble Alpes, INAC-SP2M, F-38000 Grenoble (France); Rouviere, J.L., E-mail: jean-luc.rouviere@cea.fr [CEA, INAC-SP2M, LEMMA, F-38000 Grenoble (France); Univ. Grenoble Alpes, INAC-SP2M, F-38000 Grenoble (France); Zuo, J.M. [Department of Material Science and Engineering and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL 61801 (United States); Favre-Nicolin, V. [Univ. Grenoble Alpes, INAC-SP2M, F-38000 Grenoble (France); CEA, INAC-SP2M, LEMMA, F-38000 Grenoble (France)

2016-01-15

A new method to retrieve the local lattice parameters and rotations in a crystal from off-axis convergent beam electron diffraction (CBED) patterns is presented and validated using Bloch wave dynamical simulations. The originality of the method is to use both the diffracted and transmitted beams and to use kinematical approximations in the fitting algorithm. The study is based on the deformation gradient tensor F which includes rotation and strain. Working on simulated images it is shown that (i) from a single direction of observation, seven parameters out of the nine parameters of F can be determined with an accuracy of 3×10{sup −4} for the normal strain parameters ε{sub xx}, ε{sub yy}, and ε{sub zz}, (ii) the unit cell volume can only be retrieved if the diffracted and transmitted beams are both included in the fitting and (iii) all the nine parameters of F can be determined by combining two directions of observation separated by about 20°. - Highlights: • New CBED strain retrieval method using both deficient and excess HOLZ lines. • From a single CBED pattern, the unit cell volume can be measured without ambiguity. • From a single pattern, seven parameters of the deformation tensor F can be determined. • From two patterns from two directions separated by 20°, the nine parameters are retrieved. • Algorithm validated using dynamical simulations.

Conical diffraction as a versatile building block to implement new imaging modalities for superresolution in fluorescence microscopy

Science.gov (United States)

Fallet, Clément; Caron, Julien; Oddos, Stephane; Tinevez, Jean-Yves; Moisan, Lionel; Sirat, Gabriel Y.; Braitbart, Philippe O.; Shorte, Spencer L.

2014-08-01

We present a new technology for super-resolution fluorescence imaging, based on conical diffraction. Conical diffraction is a linear, singular phenomenon taking place when a polarized beam is diffracted through a biaxial crystal. The illumination patterns generated by conical diffraction are more compact than the classical Gaussian beam; we use them to generate a super-resolution imaging modality. Conical Diffraction Microscopy (CODIM) resolution enhancement can be achieved with any type of objective on any kind of sample preparation and standard fluorophores. Conical diffraction can be used in multiple fashion to create new and disruptive technologies for super-resolution microscopy. This paper will focus on the first one that has been implemented and give a glimpse at what the future of microscopy using conical diffraction could be.

Temperature gradient method for lipid phase diagram construction using time-resolved x-ray diffraction

International Nuclear Information System (INIS)

Caffrey, M.; Hing, F.S.

1987-01-01

A method that enables temperature-composition phase diagram construction at unprecedented rates is described and evaluated. The method involves establishing a known temperature gradient along the length of a metal rod. Samples of different compositions contained in long, thin-walled capillaries are positioned lengthwise on the rod and equilibrated such that the temperature gradient is communicated into the sample. The sample is then moved through a focused, monochromatic synchrotron-derived x-ray beam and the image-intensified diffraction pattern from the sample is recorded on videotape continuously in live-time as a function of position and, thus, temperature. The temperature at which the diffraction pattern changes corresponds to a phase boundary, and the phase(s) existing (coexisting) on either side of the boundary can be identified on the basis of the diffraction pattern. Repeating the measurement on samples covering the entire composition range completes the phase diagram. These additional samples can be conveniently placed at different locations around the perimeter of the cylindrical rod and rotated into position for diffraction measurement. Temperature-composition phase diagrams for the fully hydrated binary mixtures, dimyristoylphosphatidylcholine (DMPC)/dipalmitoylphosphatidylcholine (DPPC) and dipalmitoylphosphatidylethanolamine (DPPE)/DPPC, have been constructed using the new temperature gradient method. They agree well with and extend the results obtained by other techniques. In the DPPE/DPPC system structural parameters as a function of temperature in the various phases including the subgel phase are reported. The potential limitations of this steady-state method are discussed

Monitoring protein precipitates by in-house X-ray powder diffraction

DEFF Research Database (Denmark)

Ståhl, Kenny; Frankær, Christian Grundahl; Petersen, Jakob

2013-01-01

of such calculated powder patterns from insulin and lysozyme have been included in the powder diffraction database and successfully used for search-match identification. However, the fit could be much improved if peak asymmetry and multiple bulk-solvent corrections were included. When including a large number...

Two-dimensional time-resolved x-ray diffraction study of dual phase rapid solidification in steels

Science.gov (United States)

Yonemura, Mitsuharu; Osuki, Takahiro; Terasaki, Hidenori; Komizo, Yuichi; Sato, Masugu; Toyokawa, Hidenori; Nozaki, Akiko

2010-01-01

The high intensity heat source used for fusion welding creates steep thermal gradients of 100 °C/s from 1800 °C. Further, the influence of preferred orientation is important for the observation of a directional solidification that follows the dendrite growth along the ⟨100⟩ direction toward the moving heat source. In the present study, we observed the rapid solidification of weld metal at a time resolution of 0.01-0.1 s by a two-dimensional time-resolved x-ray diffraction (2DTRXRD) system for real welding. The diffraction rings were dynamically observed by 2DTRXRD with synchrotron energy of 18 keV while the arc passes over the irradiation area of the x-rays. The arc power output was 10 V-150 A, and the scan speed of the arc was 1.0 mm/s. The temperature rise in instruments was suppressed by a water-cooled copper plate under the specimen. Further, the temperature distribution of the weld metal was measured by a thermocouple and correlated with the diffraction patterns. Consequently, solidification and solid phase transformation of low carbon steels and stainless steels were observed during rapid cooling by 2DTRXRD. In the low carbon steel, the microstructure is formed in a two step process, (i) formation of crystallites and (ii) increase of crystallinity. In stainless steel, the irregular interface layer of δ/γ in the quenched metal after solidification is expected to show the easy movement of dendrites at a lower temperature. In carbide precipitation stainless steel, it is easy for NbC to grow on δ phase with a little undercooling. Further, a mistlike pattern, which differs from the halo pattern, in the fusion zone gave some indication of the possibilities to observe the nucleation and the early solidification by 2DTRXRD.

Photolithographic Pattern Transformation by Backside Exposure in a-Si:H Thin-Film Transistor Liquid Crystal Displays

Science.gov (United States)

Uchikoga, Shuichi; Hiromasu, Yasunobu; Onozuka, Yutaka; Koizumi, Takashi; Akiyama, Masahiko; Ikeda, Mitsushi; Suzuki, Kouji

1995-02-01

Resist pattern transformation by backside exposure, which is a key process for a self-alignment technique is investigated. The light intensity and a-Si:H thickness markedly affect the pattern transformation, while the effect of gate insulator thickness is small. Numerical simulations based on Fresnel diffraction showed fairly good agreement with the experimental results.

High resolution electron microscopy and electron diffraction of YBa2Cu3O(7-x)

International Nuclear Information System (INIS)

Krakow, W.; Shaw, T.M.

1988-01-01

Experimental high resolution electron micrographs and computer simulation experiments have been used to evaluate the visibility of the atomic constituents of YBa 2 Cu 3 O(7-x). In practice, the detection of oxygen has not been possible in contradiction to that predicted by modelling of perfect crystalline material. Preliminary computer experiments of the electron diffraction patterns when oxygen vacancies are introduced on the Cu-O sheets separating Ba layers show the diffuse streaks characteristic of short range ordering. 7 references

Engineering related neutron diffraction measurements probing strains, texture and microstructure

Energy Technology Data Exchange (ETDEWEB)

Clausen, Bjorn [Los Alamos National Laboratory; Brown, Donald W [Los Alamos National Laboratory; Tome, Carlos N [Los Alamos National Laboratory; Balogh, Levente [Los Alamos National Laboratory; Vogel, Sven C [Los Alamos National Laboratory

2010-01-01

Neutron diffraction has been used for engineering applications for nearly three decades. The basis of the technique is powder diffraction following Bragg's Law. From the measured diffraction patterns information about internal, or residual, strain can be deduced from the peak positions, texture information can be extracted from the peak intensities, and finally the peak widths can provide information about the microstructure, e.g. dislocation densities and grain sizes. The strains are measured directly from changes in lattice parameters, however, in many cases it is non-trivial to determine macroscopic values of stress or strain from the measured data. The effects of intergranular strains must be considered, and combining the neutron diffraction measurements with polycrystal deformation modeling has proven invaluable in determining the overall stress and strain values of interest in designing and dimensioning engineering components. Furthelmore, the combined use of measurements and modeling has provided a tool for elucidating basic material properties, such as critical resolved shear stresses for the active deformation modes and their evolution as a function of applied deformation.

A Dictionary Approach to Electron Backscatter Diffraction Indexing.

Science.gov (United States)

Chen, Yu H; Park, Se Un; Wei, Dennis; Newstadt, Greg; Jackson, Michael A; Simmons, Jeff P; De Graef, Marc; Hero, Alfred O

2015-06-01

We propose a framework for indexing of grain and subgrain structures in electron backscatter diffraction patterns of polycrystalline materials. We discretize the domain of a dynamical forward model onto a dense grid of orientations, producing a dictionary of patterns. For each measured pattern, we identify the most similar patterns in the dictionary, and identify boundaries, detect anomalies, and index crystal orientations. The statistical distribution of these closest matches is used in an unsupervised binary decision tree (DT) classifier to identify grain boundaries and anomalous regions. The DT classifies a pattern as an anomaly if it has an abnormally low similarity to any pattern in the dictionary. It classifies a pixel as being near a grain boundary if the highly ranked patterns in the dictionary differ significantly over the pixel's neighborhood. Indexing is accomplished by computing the mean orientation of the closest matches to each pattern. The mean orientation is estimated using a maximum likelihood approach that models the orientation distribution as a mixture of Von Mises-Fisher distributions over the quaternionic three sphere. The proposed dictionary matching approach permits segmentation, anomaly detection, and indexing to be performed in a unified manner with the additional benefit of uncertainty quantification.

Evaluation of In-Vacuum Imaging Plate Detector for X-Ray Diffraction Microscopy

International Nuclear Information System (INIS)

Nishino, Yoshinori; Takahashi, Yukio; Yamamoto, Masaki; Ishikawa, Tetsuya

2007-01-01

We performed evaluation tests of a newly developed in-vacuum imaging plate (IP) detector for x-ray diffraction microscopy. IP detectors have advantages over direct x-ray detection charge-coupled device (CCD) detectors, which have been commonly used in x-ray diffraction microscopy experiments, in the capabilities for a high photon count and for a wide area. The detector system contains two IPs to make measurement efficient by recording data with the one while reading or erasing the other. We compared speckled diffraction patterns of single particles taken with the IP and a direct x-ray detection CCD. The IP was inferior to the CCD in spatial resolution and in signal-to-noise ratio at a low photon count

Effect of recording condition on the diffraction efficiency of magnetic hologram with magnetic garnet films

Energy Technology Data Exchange (ETDEWEB)

Nakamura, Yuichi, E-mail: nakamura@ee.tut.ac.jp; Takagi, Hiroyuki; Lim, Pang Boey; Inoue, Mitsuteru [Department of Electrical and Electronic Engineering, Toyohashi University of Technology, 1-1 Tempaku-cho, Toyohashi, Aichi 441-8580 (Japan)

2014-09-14

A holographic memory has been attracting attention as recording media with high recording density and high data transfer rate. We have studied the magnetic garnets as a rewritable and long life media for magnetic holography. However, since the signal intensity of reconstructed image was relatively low, the effects of recording conditions on the diffraction efficiency of magnetic hologram were investigated with experiments and the numerical simulation using COMSOL multi-physics. The diffraction efficiency tends to decrease as increasing the spatial frequency, and the use of short pulse laser with the pulse width of 50 ps was found to be effective to achieve high diffraction efficiency. This suggests that the formation of clear magnetic fringe similar to interference pattern can be obtained by the use of short pulse laser since undesirable heat diffusion during radiation does not occur. On the other hand, the diffraction efficiency increased as increasing the film thickness up to 3.1 μm but was saturated in the garnet film thicker than 3.1 μm in the case of spatial frequency of 1500 line pair/mm. The numerical simulation showed that the effective depth of magnetic fringe was limited about 1.8 μm irrespective of the garnet film thickness because the fringes were connected by thermal diffusion near the surface of the film, and the effective depth is limited due to this connection of the magnetic fringe. Avoiding this fringe connection, much higher diffraction efficiency will be achieved.

Determination of Ni(II) crystal structure by powder x-ray diffraction ...

African Journals Online (AJOL)

X-ray powder diffraction pattern was used to determine the length of the unit cell, “a”, the lattice structure type, and the number of atoms per unit cell of Ni(II) crystal. The “a” value was determined to be 23.66 ± 0.005 Å, particle size of 34.87 nm, volume 13.24 Å and Strain value ε = 9.8 x 10-3. The cell search on PXRD patterns ...

submitter Digital Image Correlation of 2D X-ray Powder Diffraction Data for Lattice Strain Evaluation

CERN Document Server

Zhang, Hongjia; Salvati, Enrico; Daisenberger, Dominik; Lunt, Alexander J G; Fong, Kai Soon; Song, Xu; Korsunsky, Alexander M

2018-01-01

High energy 2D X-ray powder diffraction experiments are widely used for lattice strain measurement. The 2D to 1D conversion of diffraction patterns is a necessary step used to prepare the data for full pattern refinement, but is inefficient when only peak centre position information is required for lattice strain evaluation. The multi-step conversion process is likely to lead to increased errors associated with the ‘caking’ (radial binning) or fitting procedures. A new method is proposed here that relies on direct Digital Image Correlation analysis of 2D X-ray powder diffraction patterns (XRD-DIC, for short). As an example of using XRD-DIC, residual strain values along the central line in a Mg AZ31B alloy bar after 3-point bending are calculated by using both XRD-DIC and the conventional ‘caking’ with fitting procedures. Comparison of the results for strain values in different azimuthal angles demonstrates excellent agreement between the two methods. The principal strains and directions are calculated...

Time-resolved x-ray diffraction techniques for bulk polycrystalline materials under dynamic loading

Energy Technology Data Exchange (ETDEWEB)

Lambert, P. K.; Hustedt, C. J.; Zhao, M.; Ananiadis, A. G.; Hufnagel, T. C. [Department of Materials Science and Engineering, Johns Hopkins University, Baltimore, Maryland 21218 (United States); Vecchio, K. S. [Department of NanoEngineering, University of California San Diego, La Jolla, California 92093 (United States); Huskins, E. L. [Oak Ridge Institute for Science and Education, Oak Ridge, Tennessee 37830 (United States); US Army Research Laboratory, Aberdeen Proving Ground, Aberdeen, Maryland 21005 (United States); Casem, D. T. [US Army Research Laboratory, Aberdeen Proving Ground, Aberdeen, Maryland 21005 (United States); Gruner, S. M. [Department of Physics, Cornell University, Ithaca, New York 14853 (United States); Cornell High Energy Synchrotron Source (CHESS), Cornell University, Ithaca, New York 14853 (United States); Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, New York 14853 (United States); Tate, M. W.; Philipp, H. T.; Purohit, P.; Weiss, J. T. [Department of Physics, Cornell University, Ithaca, New York 14853 (United States); Woll, A. R. [Cornell High Energy Synchrotron Source (CHESS), Cornell University, Ithaca, New York 14853 (United States); Kannan, V.; Ramesh, K. T. [Department of Mechanical Engineering, Johns Hopkins University, Baltimore, Maryland 21218 (United States); Kenesei, P.; Okasinski, J. S.; Almer, J. [X-ray Science Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)

2014-09-15

We have developed two techniques for time-resolved x-ray diffraction from bulk polycrystalline materials during dynamic loading. In the first technique, we synchronize a fast detector with loading of samples at strain rates of ∼10{sup 3}–10{sup 4} s{sup −1} in a compression Kolsky bar (split Hopkinson pressure bar) apparatus to obtain in situ diffraction patterns with exposures as short as 70 ns. This approach employs moderate x-ray energies (10–20 keV) and is well suited to weakly absorbing materials such as magnesium alloys. The second technique is useful for more strongly absorbing materials, and uses high-energy x-rays (86 keV) and a fast shutter synchronized with the Kolsky bar to produce short (∼40 μs) pulses timed with the arrival of the strain pulse at the specimen, recording the diffraction pattern on a large-format amorphous silicon detector. For both techniques we present sample data demonstrating the ability of these techniques to characterize elastic strains and polycrystalline texture as a function of time during high-rate deformation.

Order-disorder phase transformations in quaternary pyrochlore oxide system: Investigated by X-ray diffraction, transmission electron microscopy and Raman spectroscopic techniques

International Nuclear Information System (INIS)

Radhakrishnan, A.N.; Prabhakar Rao, P.; Sibi, K.S.; Deepa, M.; Koshy, Peter

2009-01-01

Order-disorder transformations in a quaternary pyrochlore oxide system, Ca-Y-Zr-Ta-O, were studied by powder X-ray diffraction (XRD) method, transmission electron microscope (TEM) and FT-NIR Raman spectroscopic techniques. The solid solutions in different ratios, 4:1, 2:1, 1:1, 1:2, 1:4, 1:6, of CaTaO 3.5 and YZrO 3.5 were prepared by the conventional high temperature ceramic route. The XRD results and Rietveld analysis revealed that the crystal structure changed from an ordered pyrochlore structure to a disordered defect fluorite structure as the ratios of the solid solutions of CaTaO 3.5 and YZrO 3.5 were changed from 4:1 to 1:4. This structural transformation in the present system is attributed to the lowering of the average cation radius ratio, r A /r B as a result of progressive and simultaneous substitution of larger cation Ca 2+ for Y 3+ at A sites and smaller cation Ta 5+ for Zr 4+ at B sites. Raman spectroscopy and TEM analysis corroborated the XRD results. - Graphical abstract: Selected area electron diffraction (SAED) patterns showed highly ordered diffraction maxima with characteristic superlattice weak diffraction spots of the pyrochlore structure for (a) Ca 0.6 7Y 1.33 Zr 1.33 Ta 0.33 O 7 (C2YZT2) and bright diffraction maxima arranged in a ring pattern of the fluorite structure for (b) Ca 0.29 7Y 1.71 Zr 1.71 Ta 0.29 O 7 (CY6Z6T).

Diffraction-Induced Bidimensional Talbot Self-Imaging with Full Independent Period Control

Science.gov (United States)

Guillet de Chatellus, Hugues; Romero Cortés, Luis; Deville, Antonin; Seghilani, Mohamed; Azaña, José

2017-03-01

We predict, formulate, and observe experimentally a generalized version of the Talbot effect that allows one to create diffraction-induced self-images of a periodic two-dimensional (2D) waveform with arbitrary control of the image spatial periods. Through the proposed scheme, the periods of the output self-image are multiples of the input ones by any desired integer or fractional factor, and they can be controlled independently across each of the two wave dimensions. The concept involves conditioning the phase profile of the input periodic wave before free-space diffraction. The wave energy is fundamentally preserved through the self-imaging process, enabling, for instance, the possibility of the passive amplification of the periodic patterns in the wave by a purely diffractive effect, without the use of any active gain.

Development of Kossel micro-diffraction for strain and stress analysis at the micrometer scale: applications to crystalline materials

International Nuclear Information System (INIS)

Bouscaud, D.

2012-01-01

X-ray diffraction is a non-destructive method frequently used in materials science to analyse the stress state at a macroscopic scale. Due to the growing complexity of new materials and their applications, it is necessary to know the strain and stress state at a lower scale. Thus, a Kossel micro-diffraction experimental set-up was developed inside a scanning electron microscope. It allows to obtain the crystallographic orientation as well as the strains and stresses within a volume of a few cubic micrometers. Some experiments were also performed using a synchrotron radiation. An experimental procedure was developed to optimize the acquisition of Kossel line patterns and their post-processing. The stress calculation from Kossel patterns was validated by comparing the stress state of single crystals during in situ mechanical loading, obtained by Kossel micro-diffraction and with classical diffraction methods. Then Kossel micro-diffraction was applied to polycrystalline samples by gradually decreasing the grain size. Intergranular stress heterogeneities were for example measured in an interstitial-free steel. Experiments were finally carried out in thin layer samples representative of microelectronic components. (author)

Digital diffractive optics: Have diffractive optics entered mainstream industry yet?

Science.gov (United States)

Kress, Bernard; Hejmadi, Vic

2010-05-01

When a new technology is integrated into industry commodity products and consumer electronic devices, and sold worldwide in retail stores, it is usually understood that this technology has then entered the realm of mainstream technology and therefore mainstream industry. Such a leap however does not come cheap, as it has a double edge sword effect: first it becomes democratized and thus massively developed by numerous companies for various applications, but also it becomes a commodity, and thus gets under tremendous pressure to cut down its production and integration costs while not sacrificing to performance. We will show, based on numerous examples extracted from recent industry history, that the field of Diffractive Optics is about to undergo such a major transformation. Such a move has many impacts on all facets of digital diffractive optics technology, from the optical design houses to the micro-optics foundries (for both mastering and volume replication), to the final product integrators or contract manufacturers. The main causes of such a transformation are, as they have been for many other technologies in industry, successive technological bubbles which have carried and lifted up diffractive optics technology within the last decades. These various technological bubbles have been triggered either by real industry needs or by virtual investment hype. Both of these causes will be discussed in the paper. The adjective ""digital"" in "digital diffractive optics" does not refer only, as it is done in digital electronics, to the digital functionality of the element (digital signal processing), but rather to the digital way they are designed (by a digital computer) and fabricated (as wafer level optics using digital masking techniques). However, we can still trace a very strong similarity between the emergence of micro-electronics from analog electronics half a century ago, and the emergence of digital optics from conventional optics today.

Theoretical study of noble gases diffraction from Ru(0001) using van der Waals DFT-based potentials

International Nuclear Information System (INIS)

Del Cueto, M; Muzas, A S; Martín, F; Díaz, C

2015-01-01

This study aims to analyze the role of van der Waals forces in the diffraction process of noble gases from a metal surface. We made use of different vdW implementations to rationalize the effect of dispersion forces on the corrugation of the system, the resulting scattering patterns and on the eventual diffraction results. (paper)

Diffractive interactions

International Nuclear Information System (INIS)

Del Duca, V.; Marage, P.

1996-08-01

The general framework of diffractive deep inelastic scattering is introduced and reports given in the session on diffractive interactions at the international workshop on deep-inelastic scattering and related phenomena, Rome, April 1996, are presented. (orig.)

Characterization of CuCl quantum dots grown in NaCl single crystals via optical measurements, X-ray diffraction, and transmission electron microscopy

Science.gov (United States)

Miyajima, Kensuke; Akatsu, Tatsuro; Itoh, Ken

2018-05-01

We evaluated the crystal size, shape, and alignment of the lattice planes of CuCl quantum dots (QDs) embedded in NaCl single crystals by optical measurements, X-ray diffraction (XRD) patterns, and transmission electron microscopy (TEM). We obtained, for the first time, an XRD pattern and TEM images for CuCl QDs in NaCl crystals. The XRD pattern showed that the lattice planes of the CuCl QDs were parallel to those of the NaCl crystals. In addition, the size of the QDs was estimated from the diffraction width. It was apparent from the TEM images that almost all CuCl QDs were polygonal, although some cubic QDs were present. The mean size and size distribution of the QDs were also obtained. The dot size obtained from optical measurements, XRD, and TEM image were almost consistent. Our new findings can help to reveal the growth mechanism of semiconductor QDs embedded in a crystallite matrix. In addition, this work will play an important role in progressing the study of optical phenomena originating from assembled semiconductor QDs.

Amplitude-phase characteristics of electromagnetic fields diffracted by a hole in a thin film with realistic optical properties

Science.gov (United States)

Dorofeyev, Illarion

2009-03-01

Characteristics of a quasi-spherical wave front of an electromagnetic field diffracted by a subwavelength hole in a thin film with real optical properties are studied. Related diffraction problem is solved in general by use of the scalar and vector Green's theorems and related Green's function of a boundary-value problem. Local phase deviations of a diffracted wave front from an ideal spherical front are calculated. Diffracted patterns are calculated for the coherent incident fields in case of holes array in a screen of perfect conductivity.

Diffraction coherence in optics

CERN Document Server

Françon, M; Green, L L

2013-01-01

Diffraction: Coherence in Optics presents a detailed account of the course on Fraunhofer diffraction phenomena, studied at the Faculty of Science in Paris. The publication first elaborates on Huygens' principle and diffraction phenomena for a monochromatic point source and diffraction by an aperture of simple form. Discussions focus on diffraction at infinity and at a finite distance, simplified expressions for the field, calculation of the path difference, diffraction by a rectangular aperture, narrow slit, and circular aperture, and distribution of luminous flux in the airy spot. The book th

Determination of the hexagonal network parameters of the quartz β using neutron multiple diffraction

International Nuclear Information System (INIS)

Campos, L.C.; Parente, C.B.R.; Mazzocchi, V.L.; Helene, O.

2000-01-01

In this work, neutron multiple diffraction is employed for the determination of the parameters a and c of the β-quartz hexagonal cell. This crystalline phase of silica (SiO 2 ) occurs in temperatures between ca. 846 and 1143 K. A β-quartz neutron multiple diffraction pattern has been used in the determinations. This pattern was obtained with a natural quartz single crystal heated to 1003 K. During the indexing of the pattern it was verified that most of the pairs of secondary reflections, which are responsible for the formation of peaks, could be classified as 'good for the determination of a' or 'good for the determination of c'. With this classification, it became possible to employ an iterative method for the determination of both parameters. After 8 cycles of iteration the values found for the parameters were a = 4.9964 +- 0.0018 and c = 5.46268 +- 0.00052 A. (author)

ATALANTA: a multicomponent pulsed neutron diffraction analysis code

International Nuclear Information System (INIS)

Benham, M.J.; Ross, D.K.

1986-01-01

The analysis of powder diffraction patterns from metal hydrogen systems present certain problems which have been addressed in a restructured profile analysis program. The heart of this program, ATALANTA, is a routine which locates and processes small sections of the data field to which a minimal number of Bragg peaks contribute intensity. The analysis of a three component test data set is presented in order to demonstrate the method. (author)

JMFA2—a graphically interactive Java program that fits microfibril angle X-ray diffraction data

Science.gov (United States)

Steve P. Verrill; David E. Kretschmann; Victoria L. Herian

2006-01-01

X-ray diffraction techniques have the potential to decrease the time required to determine microfibril angles dramatically. In this paper, we discuss the latest version of a curve-fitting toll that permits us to reduce the time required to evaluate MFA X-ray diffraction patterns. Further, because this tool reflects the underlying physics more accurately than existing...

Dictionary Indexing of Electron Channeling Patterns.

Science.gov (United States)

Singh, Saransh; De Graef, Marc

2017-02-01

The dictionary-based approach to the indexing of diffraction patterns is applied to electron channeling patterns (ECPs). The main ingredients of the dictionary method are introduced, including the generalized forward projector (GFP), the relevant detector model, and a scheme to uniformly sample orientation space using the "cubochoric" representation. The GFP is used to compute an ECP "master" pattern. Derivative free optimization algorithms, including the Nelder-Mead simplex and the bound optimization by quadratic approximation are used to determine the correct detector parameters and to refine the orientation obtained from the dictionary approach. The indexing method is applied to poly-silicon and shows excellent agreement with the calibrated values. Finally, it is shown that the method results in a mean disorientation error of 1.0° with 0.5° SD for a range of detector parameters.

Whole-pattern fitting technique in serial femtosecond nanocrystallography

Directory of Open Access Journals (Sweden)

Ruben A. Dilanian

2016-03-01

Full Text Available Serial femtosecond X-ray crystallography (SFX has created new opportunities in the field of structural analysis of protein nanocrystals. The intensity and timescale characteristics of the X-ray free-electron laser sources used in SFX experiments necessitate the analysis of a large collection of individual crystals of variable shape and quality to ultimately solve a single, average crystal structure. Ensembles of crystals are commonly encountered in powder diffraction, but serial crystallography is different because each crystal is measured individually and can be oriented via indexing and merged into a three-dimensional data set, as is done for conventional crystallography data. In this way, serial femtosecond crystallography data lie in between conventional crystallography data and powder diffraction data, sharing features of both. The extremely small sizes of nanocrystals, as well as the possible imperfections of their crystallite structure, significantly affect the diffraction pattern and raise the question of how best to extract accurate structure-factor moduli from serial crystallography data. Here it is demonstrated that whole-pattern fitting techniques established for one-dimensional powder diffraction analysis can be feasibly extended to higher dimensions for the analysis of merged SFX diffraction data. It is shown that for very small crystals, whole-pattern fitting methods are more accurate than Monte Carlo integration methods that are currently used.

Polymerization speed and diffractive experiments in polymer network LC test cells

Science.gov (United States)

Braun, Larissa; Gong, Zhen; Habibpourmoghadam, Atefeh; Schafforz, Samuel L.; Wolfram, Lukas; Lorenz, Alexander

2018-02-01

Polymer-network liquid crystals (LCs), where the response properties of a LC can be enhanced by the presence of a porous polymer network, are investigated. In the reported experiments, liquid crystals were doped with a small amount (situ generated polymer network, the electro-optic response properties of photo cured samples were enhanced. For example, their continuous phase modulation properties led to more localized responses in samples with interdigitated electrodes, which caused suppression of selected diffraction orders in the diffraction patterns recorded in polymer network LC samples. Moreover, capacitance changes were investigated during photopolymerization of a blue phase LC.

A pipeline for comprehensive and automated processing of electron diffraction data in IPLT.

Science.gov (United States)

Schenk, Andreas D; Philippsen, Ansgar; Engel, Andreas; Walz, Thomas

2013-05-01

Electron crystallography of two-dimensional crystals allows the structural study of membrane proteins in their native environment, the lipid bilayer. Determining the structure of a membrane protein at near-atomic resolution by electron crystallography remains, however, a very labor-intense and time-consuming task. To simplify and accelerate the data processing aspect of electron crystallography, we implemented a pipeline for the processing of electron diffraction data using the Image Processing Library and Toolbox (IPLT), which provides a modular, flexible, integrated, and extendable cross-platform, open-source framework for image processing. The diffraction data processing pipeline is organized as several independent modules implemented in Python. The modules can be accessed either from a graphical user interface or through a command line interface, thus meeting the needs of both novice and expert users. The low-level image processing algorithms are implemented in C++ to achieve optimal processing performance, and their interface is exported to Python using a wrapper. For enhanced performance, the Python processing modules are complemented with a central data managing facility that provides a caching infrastructure. The validity of our data processing algorithms was verified by processing a set of aquaporin-0 diffraction patterns with the IPLT pipeline and comparing the resulting merged data set with that obtained by processing the same diffraction patterns with the classical set of MRC programs. Copyright © 2013 Elsevier Inc. All rights reserved.

Computer generated holography with intensity-graded patterns

Directory of Open Access Journals (Sweden)

Rossella Conti

2016-10-01

Full Text Available Computer Generated Holography achieves patterned illumination at the sample plane through phase modulation of the laser beam at the objective back aperture. This is obtained by using liquid crystal-based spatial light modulators (LC-SLMs, which modulate the spatial phase of the incident laser beam. A variety of algorithms are employed to calculate the phase modulation masks addressed to the LC-SLM. These algorithms range from simple gratings-and-lenses to generate multiple diffraction-limited spots, to iterative Fourier-transform algorithms capable of generating arbitrary illumination shapes perfectly tailored on the base of the target contour. Applications for holographic light patterning include multi-trap optical tweezers, patterned voltage imaging and optical control of neuronal excitation using uncaging or optogenetics. These past implementations of computer generated holography used binary input profile to generate binary light distribution at the sample plane. Here we demonstrate that using graded input sources, enables generating intensity graded light patterns and extend the range of application of holographic light illumination. At first, we use intensity-graded holograms to compensate for LC-SLM position dependent diffraction efficiency or sample fluorescence inhomogeneity. Finally we show that intensity-graded holography can be used to equalize photo evoked currents from cells expressing different level of chanelrhodopsin2 (ChR2, one of the most commonly used optogenetics light gated channels, taking into account the non-linear dependence of channel opening on incident light.

Determination of the stacking fault density in highly defective single GaAs nanowires by means of coherent diffraction imaging

Science.gov (United States)

Davtyan, Arman; Biermanns, Andreas; Loffeld, Otmar; Pietsch, Ullrich

2016-06-01

Coherent x-ray diffraction imaging is used to measure diffraction patterns from individual highly defective nanowires, showing a complex speckle pattern instead of well-defined Bragg peaks. The approach is tested for nanowires of 500 nm diameter and 500 nm height predominately composed by zinc-blende (ZB) and twinned zinc-blende (TZB) phase domains. Phase retrieval is used to reconstruct the measured 2-dimensional intensity patterns recorded from single nanowires with 3.48 nm and 0.98 nm spatial resolution. Whereas the speckle amplitudes and distribution are perfectly reconstructed, no unique solution could be obtained for the phase structure. The number of phase switches is found to be proportional to the number of measured speckles and follows a narrow number distribution. Using data with 0.98 nm spatial resolution the mean number of phase switches is in reasonable agreement with estimates taken from TEM. However, since the resolved phase domain still is 3-4 times larger than a single GaAs bilayer we explain the non-ambiguous phase reconstruction by the fact that depending on starting phase and sequence of subroutines used during the phase retrieval the retrieved phase domain host a different sequence of randomly stacked bilayers. Modelling possible arrangements of bilayer sequences within a phase domain demonstrate that the complex speckle patterns measured can indeed be explained by the random arrangement of the ZB and TZB phase domains.

Trapezoidal diffraction grating beam splitters in single crystal diamond

Science.gov (United States)

Kiss, Marcell; Graziosi, Teodoro; Quack, Niels

2018-02-01

Single Crystal Diamond has been recognized as a prime material for optical components in high power applications due to low absorption and high thermal conductivity. However, diamond microstructuring remains challenging. Here, we report on the fabrication and characterization of optical diffraction gratings exhibiting a symmetric trapezoidal profile etched into a single crystal diamond substrate. The optimized grating geometry diffracts the transmitted optical power into precisely defined proportions, performing as an effective beam splitter. We fabricate our gratings in commercially available single crystal CVD diamond plates (2.6mm x 2.6mm x 0.3mm). Using a sputter deposited hard mask and patterning by contact lithography, the diamond is etched in an inductively coupled oxygen plasma with zero platen power. The etch process effectively reveals the characteristic {111} diamond crystal planes, creating a precisely defined angled (54.7°) profile. SEM and AFM measurements of the fabricated gratings evidence the trapezoidal shape with a pitch of 3.82μm, depth of 170 nm and duty cycle of 35.5%. Optical characterization is performed in transmission using a 650nm laser source perpendicular to the sample. The recorded transmitted optical power as function of detector rotation angle shows a distribution of 21.1% in the 0th order and 23.6% in each +/-1st order (16.1% reflected, 16.6% in higher orders). To our knowledge, this is the first demonstration of diffraction gratings with trapezoidal profile in single crystal diamond. The fabrication process will enable beam splitter gratings of custom defined optical power distribution profiles, while antireflection coatings can increase the efficiency.

Soil Bacterial and Fungal Communities Show Distinct Recovery Patterns during Forest Ecosystem Restoration.

Science.gov (United States)

Sun, Shan; Li, Song; Avera, Bethany N; Strahm, Brian D; Badgley, Brian D

2017-07-15

Bacteria and fungi are important mediators of biogeochemical processes and play essential roles in the establishment of plant communities, which makes knowledge about their recovery after extreme disturbances valuable for understanding ecosystem development. However, broad ecological differences between bacterial and fungal organisms, such as growth rates, stress tolerance, and substrate utilization, suggest they could follow distinct trajectories and show contrasting dynamics during recovery. In this study, we analyzed both the intra-annual variability and decade-scale recovery of bacterial and fungal communities in a chronosequence of reclaimed mined soils using next-generation sequencing to quantify their abundance, richness, β-diversity, taxonomic composition, and cooccurrence network properties. Bacterial communities shifted gradually, with overlapping β-diversity patterns across chronosequence ages, while shifts in fungal communities were more distinct among different ages. In addition, the magnitude of intra-annual variability in bacterial β-diversity was comparable to the changes across decades of chronosequence age, while fungal communities changed minimally across months. Finally, the complexity of bacterial cooccurrence networks increased with chronosequence age, while fungal networks did not show clear age-related trends. We hypothesize that these contrasting dynamics of bacteria and fungi in the chronosequence result from (i) higher growth rates for bacteria, leading to higher intra-annual variability; (ii) higher tolerance to environmental changes for fungi; and (iii) stronger influence of vegetation on fungal communities. IMPORTANCE Both bacteria and fungi play essential roles in ecosystem functions, and information about their recovery after extreme disturbances is important for understanding whole-ecosystem development. Given their many differences in phenotype, phylogeny, and life history, a comparison of different bacterial and fungal recovery

Dynamic diffraction-limited light-coupling of 3D-maneuvered wave-guided optical waveguides.

Science.gov (United States)

Villangca, Mark; Bañas, Andrew; Palima, Darwin; Glückstad, Jesper

2014-07-28

We have previously proposed and demonstrated the targeted-light delivery capability of wave-guided optical waveguides (WOWs). As the WOWs are maneuvered in 3D space, it is important to maintain efficient light coupling through the waveguides within their operating volume. We propose the use of dynamic diffractive techniques to create diffraction-limited spots that will track and couple to the WOWs during operation. This is done by using a spatial light modulator to encode the necessary diffractive phase patterns to generate the multiple and dynamic coupling spots. The method is initially tested for a single WOW and we have experimentally demonstrated dynamic tracking and coupling for both lateral and axial displacements.

Dynamic diffraction-limited light-coupling of 3D-maneuvered wave-guided optical waveguides

DEFF Research Database (Denmark)

Villangca, Mark Jayson; Bañas, Andrew Rafael; Palima, Darwin

2014-01-01

We have previously proposed and demonstrated the targeted-light delivery capability of wave-guided optical waveguides (WOWs). As the WOWs are maneuvered in 3D space, it is important to maintain efficient light coupling through the waveguides within their operating volume. We propose the use...... of dynamic diffractive techniques to create diffraction-limited spots that will track and couple to the WOWs during operation. This is done by using a spatial light modulator to encode the necessary diffractive phase patterns to generate the multiple and dynamic coupling spots. The method is initially tested...... for a single WOW and we have experimentally demonstrated dynamic tracking and coupling for both lateral and axial displacements....

Evaluation of domain randomness in periodically poled lithium niobate by diffraction noise measurement.

Science.gov (United States)

Dwivedi, Prashant Povel; Choi, Hee Joo; Kim, Byoung Joo; Cha, Myoungsik

2013-12-16

Random duty-cycle errors (RDE) in ferroelectric quasi-phase-matching (QPM) devices not only affect the frequency conversion efficiency, but also generate non-phase-matched parasitic noise that can be detrimental to some applications. We demonstrate an accurate but simple method for measuring the RDE in periodically poled lithium niobate. Due to the equivalence between the undepleted harmonic generation spectrum and the diffraction pattern from the QPM grating, we employed linear diffraction measurement which is much simpler than tunable harmonic generation experiments [J. S. Pelc, et al., Opt. Lett.36, 864-866 (2011)]. As a result, we could relate the RDE for the QPM device to the relative noise intensity between the diffraction orders.

Stray light characteristics of the diffractive telescope system

Science.gov (United States)

Liu, Dun; Wang, Lihua; Yang, Wei; Wu, Shibin; Fan, Bin; Wu, Fan

2018-02-01

Diffractive telescope technology is an innovation solution in construction of large light-weight space telescope. However, the nondesign orders of diffractive optical elements (DOEs) may affect the imaging performance as stray light. To study the stray light characteristics of a diffractive telescope, a prototype was developed and its stray light analysis model was established. The stray light characteristics including ghost, point source transmittance, and veiling glare index (VGI) were analyzed. During the star imaging test of the prototype, the ghost images appeared around the star image as the exposure time of the charge-coupled device improving, consistent with the simulation results. The test result of VGI was 67.11%, slightly higher than the calculated value 57.88%. The study shows that the same order diffraction of the diffractive primary lens and correcting DOE is the main factor that causes ghost images. The stray light sources outside the field of view can illuminate the image plane through nondesign orders diffraction of the primary lens and contributes to more than 90% of the stray light flux on the image plane. In summary, it is expected that these works will provide some guidance for optimizing the imaging performance of diffractive telescopes.

Multiwavelength anomalous diffraction and diffraction anomalous fine structure to study composition and strain of semiconductor nano structures

International Nuclear Information System (INIS)

Favre-Nicolin, V.; Proietti, M.G.; Leclere, C.; Renevier, H.; Katcho, N.A.; Richard, M.I.

2012-01-01

The aim of this paper is to illustrate the use of Multi-Wavelength Anomalous Diffraction (MAD) and Diffraction Anomalous Fine Structure (DAFS) spectroscopy for the study of structural properties of semiconductor nano-structures. We give a brief introduction on the basic principles of these techniques providing a detailed bibliography. Then we focus on the data reduction and analysis and we give specific examples of their application on three different kinds of semiconductor nano-structures: Ge/Si nano-islands, AlN capped GaN/AlN Quantum Dots and AlGaN/AlN Nano-wires. We show that the combination of MAD and DAFS is a very powerful tool to solve the structural problem of these materials of high technological impact. In particular, the effects of composition and strain on diffraction are disentangled and composition can be determined in a reliable way, even at the interface between nano-structure and substrate. We show the great possibilities of this method and give the reader the basic tools to undertake its use. (authors)

MacDUST - a powder diffraction package developed for the ''ADONE'' high resolution diffraction station

International Nuclear Information System (INIS)

Burattini, E.; Cappuccio, G.; Maistrelli, P.; Simeoni, S.

1993-01-01

A High Resolution Powder Diffraction Station (PO.DI.STA.) was installed at the beginning of 1991 on the ADONE-Wiggler magnet beam line. The station and the first powder diffraction spectra, collected with synchrotron radiation, were presented at the EPDIC-1 Conference. More details can also be found in. For this station, a very sophisticated software package ''MacDUST'' has been developed on an Apple Macintosh computer, using the Microsoft QuickBASIC compiler. It allows very easy and comfortable operations by means of a graphical user interface environment, typical of the Macintosh system. The package consists of five major programs. The main program, MacDIFF, performs all the graphic operations on the experimental data, including zooming, overlapping, cursor scanning and editing of patterns, control of output operations to printers and HPGL plotters. It also includes several analysis routines for data smoothing, a first derivative peak search algorithm, two background subtraction routines and two profile fitting programs: one based on the simplex method and the other on the Marquardt modification of a least-square algorithm. MacPDF and MacRIC are both dedicated to phase identification. The first program is an archive manager for searching, displaying and printing phase records; MacRIC is a graphic aided search-match program based on the Hanawalt algorithm. Mac3-DIM is a plot program, useful, e.g., for representing kinetics three dimensionally. MacRIET is a Macintosh version of the well known Rietveld refinement program. This version, besides conventional structure refinements, also allows the determination of micro structural parameters, i.e. micro strain and crystallite size. The program can also be used to simulate a pattern, once the structure of the compound is known. Taking advantage of the very intuitive Macintosh graphic user interface, through dialog and alert boxes, the program allows straightforward introduction and modification of the structure

Three-dimensional diffraction of a thin metallic cylinder illuminated in conical incidence: application to diameter estimation

International Nuclear Information System (INIS)

Miguel Sanchez-Brea, Luis; Javier Salgado-Remacha, Francisco

2008-01-01

We present a model to determine the far-field diffraction pattern of a metallic cylinder of infinite length when it is illuminated in oblique incidence. This model is based on the Helmholtz-Kirchhoff integral using the Beckmann conditions for reflection. It considers the three-dimensional nature of the diffracting object as well as the material of which the cylinder is made. This model shows that the diffraction orders are placed in a cone of light. The amplitude at the far field can be divided into three terms: the first term accounts for Babinet's principle, that is, the contribution of the cylinder projection; the second term accounts for the three dimensionality of the cylinder; and the third term accounts for the material of which the cylinder is made. This model is applied to the diameter estimation of the cylinder. Since the amplitude of the Babinet contribution is much larger than the light reflected by the surface, the cylinder diameter can be obtained in a simple way. With this approximation, the locations of the diffraction minima do not vary when the cylinder is inclined. On the other hand, when the reflected light is considered the location of the minima and, hence, the estimation of the diameter, varies. Also, a modification of the diffraction minima is produced by the material of which the cylinder is made. Experimental results are also obtained that corroborate the theoretical approach

Effect of processing on the microstructure of finger millet by X-ray diffraction and scanning electron microscopy.

Science.gov (United States)

Dharmaraj, Usha; Parameswara, P; Somashekar, R; Malleshi, Nagappa G

2014-03-01

Finger millet is one of the important minor cereals, and carbohydrates form its major chemical constituent. Recently, the millet is processed to prepare hydrothermally treated (HM), decorticated (DM), expanded (EM) and popped (PM) products. The present research aims to study the changes in the microstructure of carbohydrates using X-ray diffraction and scanning electron microscopy. Processing the millet brought in significant changes in the carbohydrates. The native millet exhibited A-type pattern of X-ray diffraction with major peaks at 2θ values of 15.3, 17.86 and 23.15°, whereas, all other products showed V-type pattern with single major peak at 2θ values ranging from 19.39 to 19.81°. The corresponding lattice spacing and the number of unit cells in a particular direction of reflection also reduced revealing that crystallinity of starch has been decreased depending upon the processing conditions. Scanning electron microscopic studies also revealed that the orderly pattern of starch granules changed into a coherent mass due to hydrothermal treatment, while high temperature short time treatment rendered a honey-comb like structure to the product. However, the total carbohydrates and non-starch polysaccharide contents almost remained the same in all the products except for DM and EM, but the individual carbohydrate components changed significantly depending on the type of processing.

Quantitative determination of mineral composition by powder X-ray diffraction

International Nuclear Information System (INIS)

Pawloski, G.A.

1986-01-01

A method is described of quantitatively determining the mineral composition in a test sample containing a number (m) of minerals from a group (n) of known minerals, wherein n=13, where mless than or equal ton, by x-ray diffraction, comprising: determining from standard samples of the known minerals a set of (n) standard coefficients K/sub j/=(X/sub j//X/sub l/)(I/sub l//I/sub j/) for each mineral (j=2...n) in the group of known minerals (j=2...n) relative to one mineral (l) in the group selected as a reference mineral, where X is the weight fraction of the mineral in a standard sample, and I is the x-ray integrated intensity peak of each mineral obtained from the standard sample; obtaining an x-ray diffraction pattern of the test sample; identifying each of the (m) minerals in the test sample for the x-ray diffraction pattern; calculating the relative weight fractions X/sub j//X/sub l/ for each mineral (j=2...m) compared to the reference mineral (l) from the ratio of the measured highest integrated intensity peak I/sub j/ of each mineral in the test sample to the measured highest integrated intensity peak I/sub l/ of the reference mineral in the test sample, and from the previously determined standard coefficients, X/sub j//X/sub l/=K/sub j/(I/sub j//I/sub l/

Phase and Texture of Solution-Processed Copper Phthalocyanine Thin Films Investigated by Two-Dimensional Grazing Incidence X-Ray Diffraction

Directory of Open Access Journals (Sweden)

Lulu Deng

2011-07-01

Full Text Available The phase and texture of a newly developed solution-processed copper phthalocyanine (CuPc thin film have been investigated by two-dimensional grazing incidence X-ray diffraction. The results show that it has β phase crystalline structure, with crystallinity greater than 80%. The average size of the crystallites is found to be about 24 nm. There are two different arrangements of crystallites, with one dominating the diffraction pattern. Both of them have preferred orientation along the thin film normal. Based on the similarities to the vacuum deposited CuPc thin films, the new solution processing method is verified to offer a good alternative to vacuum process, for the fabrication of low cost small molecule based organic photovoltaics.

Colloidal graphite/graphene nanostructures using collagen showing enhanced thermal conductivity

Science.gov (United States)

Bhattacharya, Soumya; Dhar, Purbarun; Das, Sarit K; Ganguly, Ranjan; Webster, Thomas J; Nayar, Suprabha

2014-01-01

In the present study, the exfoliation of natural graphite (GR) directly to colloidal GR/graphene (G) nanostructures using collagen (CL) was studied as a safe and scalable process, akin to numerous natural processes and hence can be termed “biomimetic”. Although the exfoliation and functionalization takes place in just 1 day, it takes about 7 days for the nano GR/G flakes to stabilize. The predominantly aromatic residues of the triple helical CL forms its own special micro and nanoarchitecture in acetic acid dispersions. This, with the help of hydrophobic and electrostatic forces, interacts with GR and breaks it down to nanostructures, forming a stable colloidal dispersion. Surface enhanced Raman spectroscopy, X-ray diffraction, photoluminescence, fluorescence, and X-ray photoelectron spectroscopy of the colloid show the interaction between GR and CL on day 1 and 7. Differential interference contrast images in the liquid state clearly reveal how the GR flakes are entrapped in the CL fibrils, with a corresponding fluorescence image showing the intercalation of CL within GR. Atomic force microscopy of graphene-collagen coated on glass substrates shows an average flake size of 350 nm, and the hexagonal diffraction pattern and thickness contours of the G flakes from transmission electron microscopy confirm ≤ five layers of G. Thermal conductivity of the colloid shows an approximate 17% enhancement for a volume fraction of less than approximately 0.00005 of G. Thus, through the use of CL, this new material and process may improve the use of G in terms of biocompatibility for numerous medical applications that currently employ G, such as internally controlled drug-delivery assisted thermal ablation of carcinoma cells. PMID:24648728

Colloidal graphite/graphene nanostructures using collagen showing enhanced thermal conductivity.

Science.gov (United States)

Bhattacharya, Soumya; Dhar, Purbarun; Das, Sarit K; Ganguly, Ranjan; Webster, Thomas J; Nayar, Suprabha

2014-01-01

In the present study, the exfoliation of natural graphite (GR) directly to colloidal GR/graphene (G) nanostructures using collagen (CL) was studied as a safe and scalable process, akin to numerous natural processes and hence can be termed "biomimetic". Although the exfoliation and functionalization takes place in just 1 day, it takes about 7 days for the nano GR/G flakes to stabilize. The predominantly aromatic residues of the triple helical CL forms its own special micro and nanoarchitecture in acetic acid dispersions. This, with the help of hydrophobic and electrostatic forces, interacts with GR and breaks it down to nanostructures, forming a stable colloidal dispersion. Surface enhanced Raman spectroscopy, X-ray diffraction, photoluminescence, fluorescence, and X-ray photoelectron spectroscopy of the colloid show the interaction between GR and CL on day 1 and 7. Differential interference contrast images in the liquid state clearly reveal how the GR flakes are entrapped in the CL fibrils, with a corresponding fluorescence image showing the intercalation of CL within GR. Atomic force microscopy of graphene-collagen coated on glass substrates shows an average flake size of 350 nm, and the hexagonal diffraction pattern and thickness contours of the G flakes from transmission electron microscopy confirm ≤ five layers of G. Thermal conductivity of the colloid shows an approximate 17% enhancement for a volume fraction of less than approximately 0.00005 of G. Thus, through the use of CL, this new material and process may improve the use of G in terms of biocompatibility for numerous medical applications that currently employ G, such as internally controlled drug-delivery assisted thermal ablation of carcinoma cells.

Electron diffraction and resistivity measurements on the one-dimensional orthorhombic and monoclinic structures of TaS3

International Nuclear Information System (INIS)

Roucau, C.; Ayroles, R.; Monceau, P.

1980-01-01

Electron diffraction patterns are obtained of the orthorhombic and monoclinic structures of TaS 3 . For the orthorhombic structure one set of superlattice spots is observed at (l+-0.5)a*, (m+-0.125)b*, (n+-0.25)c* below 210 K. For the monoclinic structure two sets of superlattice spots are observed, the first one at la*, (m+-0.253)b*, nc* below 240 K, the second one at (l+-0.5)a*, (m+-0.245)b*, (n+-0.5)c* below 160 K. Diffuse scattering lines are present for the two structures. Resistivity measurements are performed on crystals with the two structures which show strong increase of the resistivity indicating metal-semiconducting transitions at the same temperatures where the superlattice spots appear. These transitions are interpreted as successive Peierls transitions on the different types of chains of TaS 3 . Also electron diffraction patterns are shown of NbSe 3 at very low temperatures where the two charge density waves that occur at 145 and 59 K are formed. A comparison is given between TaS 3 and NbSe 3 . (author)

Energy-dispersive X-ray diffraction beamline at Indus-2 synchrotron ...

Indian Academy of Sciences (India)

structure of materials under various thermodynamics conditions, viz. temperature .... design to incorporate KB mirror system when it becomes available. .... peak analysis of diffraction peaks show that diffraction resolution is also ∼2% which is.

Restoration of diffracted far field at the output of circular diffraction waveplate

International Nuclear Information System (INIS)

Hovhannisyan, D; Margaryan, H; Abrahamyan, V; Hakobyan, N; Tabiryan, N

2014-01-01

The light propagation in an anisotropic periodic media, such us circular diffraction waveplate (CDW) by a finite-difference time-domain (FDTD) technique is studied. The FDTD numerical simulation and the subsequent Fourier transform of the diffracted electric near field was been used for study of ability of CDW to diffract a laser beam and simultaneously convert polarization state. The FDTD simulation results used to restore the diffracted electric far field at the CDW output. an abstract

Contribution to diffraction theory

International Nuclear Information System (INIS)

Chako, N.

1966-11-01

In a first part, we have given a general and detailed treatment of the modern theory of diffraction. The rigorous theory is formulated as a boundary value problem of the wave equation or Maxwell equations. However, up to the present time, such a program of treating diffraction by optical systems, even for simple optical instruments, has not been realized due to the complicated character of the boundary conditions. The recent developments show clearly the nature of the approximation of the classical theories originally due to Fresnel and Young, later formulated in a rigorous manner by Kirchhoff and Rubinowicz, respectively and, at the same time the insufficiency of these theories in explaining a number of diffraction phenomena. Furthermore, we have made a study of the limitations of the approximate theories and the recent attempts to improve these. The second part is devoted to a general mathematical treatment of the theory of diffraction of optical systems including aberrations. After a general and specific analysis of geometrical and wave aberrations along classical and modern (Nijboer) lines, we have been able to evaluate the diffraction integrals representing the image field at any point in image space explicitly, when the aberrations are small. Our formulas are the generalisations of all anterior results obtained by previous investigators. Moreover, we have discussed the Zernike-Nijboer theory of aberration and generalised it not only for rotational systems, but also for non-symmetric systems as well, including the case of non circular apertures. The extension to non-circular apertures is done by introducing orthogonal functions or polynomials over such aperture shapes. So far the results are valid for small aberrations, that is to say, where the deformation of the real wave front emerging from the optical system is less than a wave length of light or of the electromagnetic wave from the ideal wave front. If the aberrations are large, then one must employ the

Spatiotemporal optical pulse transformation by a resonant diffraction grating

Energy Technology Data Exchange (ETDEWEB)

Golovastikov, N. V.; Bykov, D. A., E-mail: bykovd@gmail.com; Doskolovich, L. L., E-mail: leonid@smr.ru; Soifer, V. A. [Russian Academy of Sciences, Image Processing Systems Institute (Russian Federation)

2015-11-15

The diffraction of a spatiotemporal optical pulse by a resonant diffraction grating is considered. The pulse diffraction is described in terms of the signal (the spatiotemporal incident pulse envelope) passage through a linear system. An analytic approximation in the form of a rational function of two variables corresponding to the angular and spatial frequencies has been obtained for the transfer function of the system. A hyperbolic partial differential equation describing the general form of the incident pulse envelope transformation upon diffraction by a resonant diffraction grating has been derived from the transfer function. A solution of this equation has been obtained for the case of normal incidence of a pulse with a central frequency lying near the guided-mode resonance of a diffraction structure. The presented results of numerical simulations of pulse diffraction by a resonant grating show profound changes in the pulse envelope shape that closely correspond to the proposed theoretical description. The results of the paper can be applied in creating new devices for optical pulse shape transformation, in optical information processing problems, and analog optical computations.

Boundary diffraction wave integrals for diffraction modeling of external occulters

OpenAIRE

Cady, E.

2012-01-01

An occulter is a large diffracting screen which may be flown in conjunction with a telescope to image extrasolar planets. The edge is shaped to minimize the diffracted light in a region beyond the occulter, and a telescope may be placed in this dark shadow to view an extrasolar system with the starlight removed. Errors in position, orientation, and shape of the occulter will diffract additional light into this region, and a challenge of modeling an occulter system is to accurately and quickly...

Grain orientation mapping of passivated aluminum interconnect wires with X-ray micro-diffraction

International Nuclear Information System (INIS)

MacDowell, A.A.; Padmore, H.A.; Thompson, A.C.; Chang, C.H.; Patel, J.R.

1998-06-01

A micro x-ray diffraction facility is under development at the Advanced Light source. Spot sizes are typically about 1-microm size generated by means of grazing incidence Kirkpatrick-Baez focusing mirrors. Photon energy is either white of energy range 6--14 keV or monochromatic generated from a pair of channel cut crystals. A Laue diffraction pattern from a single grain in passivated 2-microm wide bamboo structured Aluminum interconnect line has been recorded. Acquisition times are of the order of a few seconds. The Laue pattern has allowed the determination of the crystallographic orientation of individual grains along the line length. The experimental and analysis procedures used are described, as is a grain orientation result. The future direction of this program is discussed in the context of strain measurements in the area of electromigration

Expression, purification and preliminary diffraction studies of PhnP

International Nuclear Information System (INIS)

Podzelinska, Kateryna; He, Shumei; Soares, Alexei; Zechel, David; Hove-Jensen, Bjarne; Jia, Zongchao

2008-01-01

PhnP, a member of the C—P lyase pathway, was crystallized by the sitting-drop vapour-diffusion method and the initial diffraction-pattern analysis is reported. PhnP belongs to a 14-gene operon that supports the growth of Escherichia coli on alkylphosphonates as a sole source of phosphorus; however, the exact biochemistry of phosphonate degradation by this pathway is poorly understood. The protein was recombinantly expressed in Escherichia coli and purified to homogeneity. Sitting-drop vapour diffusion in combination with microseeding was used to obtain crystals that were suitable for X-ray diffraction. Data were collected to 1.3 Å and the crystals belonged to space group C2, with unit-cell parameters a = 111.65, b = 75.41, c = 83.23 Å, α = γ = 90, β = 126.3°

Study of the diffraction in the microscope: Annular condenser

International Nuclear Information System (INIS)

Ciocci, L; Echarri, R M; Simon, J M

2011-01-01

In this work we study the diffraction in the microscope when an annular condenser is used to illuminate the object. We calculate the point spread function (PSF) for a pinhole in an opaque screen illuminated with an annular condenser, consisting in an 1D array of incoherent point sources. We compare it with the PSF for a self-luminous point object, finding that the central disk of the diffraction pattern is narrower and the first intensity minimum is deeper for illuminated objects. We also analyze the resolution of the system by means of the intensity profile produced by two points objects, finding that two self luminous point objects are better resolved than two illuminated objects at the same distance. This suggests that the correlation introduced in the object diminishes the resolution in the former case.

Angular beam width of a slit-diffracted wave with noncollinear group and phase velocities

International Nuclear Information System (INIS)

Lock, Edwin H

2012-01-01

Taking magnetostatic surface wave diffraction as an example, this paper theoretically investigates the 2D diffraction pattern arising in the far-field region of a ferrite slab in the case of a plane wave with noncollinear group and phase velocities incident on a wide, arbitrarily oriented slit in an opaque screen. A universal analytical formula for the angular width of a diffracted beam is derived, which is valid for magnetostatic and other types of waves in anisotropic media and structures (including metamaterials) in 2D geometries. It is shown that the angular width of a diffracted beam in an anisotropic medium can not only take values greater or less than λ 0 /D (where λ 0 is the incident wavelength, and D is the slit width), but can also be zero under certain conditions. (methodological notes)

Crystallization and preliminary X-ray diffraction analysis of the fructofuranosidase from Schwanniomyces occidentalis

International Nuclear Information System (INIS)

Polo, Aitana; Álvaro-Benito, Miguel; Fernández-Lobato, María; Sanz-Aparicio, Julia

2009-01-01

The invertase from Schwanniomyces occidentalis has been expressed in Saccharomyces cerevisiae, purified and crystallized. The wild-type enzyme was also purified and crystallized and diffraction data were collected to 2.9 Å resolution. Schwanniomyces occidentalis invertase is an extracellular enzyme that releases β-fructose from the nonreducing termini of various β-d-fructofuranoside substrates. Its ability to produce 6-kestose by transglycosylation makes this enzyme an interesting research target for applications in industrial biotechnology. The enzyme has been expressed in Saccharomyces cerevisiae. Recombinant and wild-type forms, which showed different glycosylation patterns, were crystallized by vapour-diffusion methods. Although crystallization trials were conducted on both forms of the protein, crystals suitable for X-ray crystallographic analyses were only obtained from the wild-type enzyme. The crystals belonged to space group P2 1 2 1 2 1 , with unit-cell parameters a = 105.78, b = 119.49, c = 137.68 Å. A diffraction data set was collected using a synchrotron source. Self-rotation function and sedimentation-velocity experiments suggested that the enzyme was dimeric with twofold symmetry

Model experiment of in vivo synchrotron X-ray diffraction of human kidney stones

Energy Technology Data Exchange (ETDEWEB)

Ancharov, A.I. [Institute of Solid State Chemistry and Mechanochemistry SB RAS, Novosibirsk (Russian Federation)]. E-mail: ancharov@mail.ru; Potapov, S.S. [Institute of Mineralogy UB RAS, Miass (Russian Federation); Moiseenko, T.N. [The State Regional Clinical Hospital, Novosibirsk (Russian Federation); Feofilov, I.V. [The State Regional Clinical Hospital, Novosibirsk (Russian Federation); Nizovskii, A.I. [Boreskov Institute of Catalysis SB RAS, Novosibirsk (Russian Federation)

2007-05-21

The diffraction of synchrotron radiation (SR) was used to explore the phase composition of kidney stones placed into a specific object phantom, which imitated the human body. As an imitation of the patient breath, the kidney stone was moved vertically and rotated to an angle of 15{sup o} during the recording of the X-ray pattern. It was shown that rotation and displacement did not distort the X-ray pattern.

Model experiment of in vivo synchrotron X-ray diffraction of human kidney stones

International Nuclear Information System (INIS)

Ancharov, A.I.; Potapov, S.S.; Moiseenko, T.N.; Feofilov, I.V.; Nizovskii, A.I.

2007-01-01

The diffraction of synchrotron radiation (SR) was used to explore the phase composition of kidney stones placed into a specific object phantom, which imitated the human body. As an imitation of the patient breath, the kidney stone was moved vertically and rotated to an angle of 15 o during the recording of the X-ray pattern. It was shown that rotation and displacement did not distort the X-ray pattern

Higher-order harmonics of limited diffraction Bessel beams

Science.gov (United States)

Ding; Lu

2000-03-01

We investigate theoretically the nonlinear propagation of the limited diffraction Bessel beam in nonlinear media, under the successive approximation of the KZK equation. The result shows that the nth-order harmonic of the Bessel beam, like its fundamental component, is radially limited diffracting, and that the main beamwidth of the nth-order harmonic is exactly 1/n times that of the fundamental.

Surface diffusion studies by optical diffraction techniques

International Nuclear Information System (INIS)

Xiao, X.D.

1992-11-01

The newly developed optical techniques have been combined with either second harmonic (SH) diffraction or linear diffraction off a monolayer adsorbate grating for surface diffusion measurement. Anisotropy of surface diffusion of CO on Ni(l10) was used as a demonstration for the second harmonic dim reaction method. The linear diffraction method, which possesses a much higher sensitivity than the SH diffraction method, was employed to study the effect of adsorbate-adsorbate interaction on CO diffusion on Ni(l10) surface. Results showed that only the short range direct CO-CO orbital overlapping interaction influences CO diffusion but not the long range dipole-dipole and CO-NI-CO interactions. Effects of impurities and defects on surface diffusion were further explored by using linear diffraction method on CO/Ni(110) system. It was found that a few percent S impurity can alter the CO diffusion barrier height to a much higher value through changing the Ni(110) surface. The point defects of Ni(l10) surface seem to speed up CO diffusion significantly. A mechanism with long jumps over multiple lattice distance initiated by CO filled vacancy is proposed to explain the observed defect effect

Encapsulation process for diffraction gratings.

Science.gov (United States)

Ratzsch, Stephan; Kley, Ernst-Bernhard; Tünnermann, Andreas; Szeghalmi, Adriana

2015-07-13

Encapsulation of grating structures facilitates an improvement of the optical functionality and/or adds mechanical stability to the fragile structure. Here, we introduce novel encapsulation process of nanoscale patterns based on atomic layer deposition and micro structuring. The overall size of the encapsulated structured surface area is only restricted by the size of the available microstructuring and coating devices; thus, overcoming inherent limitations of existing bonding processes concerning cleanliness, roughness, and curvature of the components. Finally, the process is demonstrated for a transmission grating. The encapsulated grating has 97.5% transmission efficiency in the -1st diffraction order for TM-polarized light, and is being limited by the experimental grating parameters as confirmed by rigorous coupled wave analysis.

Two-dimensional Kikuchi patterns of Si as measured using an electrostatic analyser

Energy Technology Data Exchange (ETDEWEB)

Vos, Maarten, E-mail: maarten.vos@anu.edu.au [Electronic Materials Engineering Department, Research School of Physics and Engineering, The Australian National University, Canberra 2601 (Australia); Winkelmann, Aimo [Bruker Nano GmbH, Am Studio 2D, Berlin 12489 (Germany)

2016-12-15

We present Kikuchi patterns of Si single crystals measured with an electrostatic analyser, where the kinetic energy of the diffracted electron is known with sub-eV precision. Two-dimensional patterns are acquired by rotating the crystal under computer control. This makes detailed comparison of calculated and measured distributions possible with precise knowledge of the energy of the scattered electrons. The case of Si is used to validate the method, and these experiments provide a detailed comparison of measured and calculated Kikuchi patterns. In this way, we can gain more insight on Kikuchi pattern formation in non-energy resolved measurements of conventional electron backscatter diffraction (EBSD) and electron channeling patterns (ECP). It was possible to identify the influence of channeling of the incoming beam on the measured Kikuchi pattern. The effect of energy loss on the Kikuchi pattern was established, and it is demonstrated that, under certain conditions, the channeling features have a different dependence on the energy loss compared to the Kikuchi lines. - Highlights: • Two-dimensional Kikuchi patterns measured for Silicon with electrostatic analyser. • Good agreement obtained with dynamical theory of diffraction. • Channeling effects of the incoming beam are identified.

Profile analysis of neutron powder diffraction data at ISIS

International Nuclear Information System (INIS)

David, W.I.F.; Ibberson, R.M.; Matthewman, J.C.

1992-05-01

The aim of this manual is to document the current suite of time-of-flight neutron powder diffraction profile refinement programs available to ISIS users. Aspects of data collation and normalisation specific to the individual diffraction instruments are dealt with elsewhere. It will be assumed the user has produced a suitable data file (.DAT file) containing the profile data consisting of point by point values of the corrected diffraction profile across the pattern. The analysis of neutron powder diffraction data at ISIS by profile refinement utilises a suite of ''in-house'' written and supported programs based on the Cambridge Crystallography Subroutine Library (CCSL). A quick scan through the CCSL manual will give the user a general feel for the procedure to adopt in the use of the library and hence of the profile codes. The instructions documented in this handbook are complementary to those in the more specialist CCSL manual, and consequently go into no great detail regarding technical details of any of the CCSL routines. The programs may be run from each individual user account, for example [USER01], once the appropriate login procedure has been set-up by the instrument scientists. The programs are mostly activated by one line commands and only a basic knowledge of a VAX editor should be required; details can be found in the ''VAX primer'' available from Computer Support. (Author)

Electron diffraction study of the sillenites Bi12SiO20, Bi25FeO39 and Bi25InO39: Evidence of short-range ordering of oxygen-vacancies in the trivalent sillenites

Directory of Open Access Journals (Sweden)

Craig A. Scurti

2014-08-01

Full Text Available We present an electron diffraction study of three sillenites, Bi12SiO20, Bi25FeO39, and Bi25InO39 synthesized using the solid-state method. We explore a hypothesis, inspired by optical studies in the literature, that suggests that trivalent sillenites have additional disorder not present in the tetravalent compounds. Electron diffraction patterns of Bi25FeO39 and Bi25InO39 show streaks that confirm deviations from the ideal sillenite structure. Multi-slice simulations of electron-diffraction patterns are presented for different perturbations to the sillenite structure - partial substitution of the M site by Bi3+, random and ordered oxygen-vacancies, and a frozen-phonon model. Although comparison of experimental data to simulations cannot be conclusive, we consider the streaks as evidence of short-range ordered oxygen-vacancies.

Full k-space visualization of photoelectron diffraction

International Nuclear Information System (INIS)

Denlinger, J.D.; Rotenberg, E.; Kevan, S.D.; Tonner, B.P.

1997-01-01

The development of photoelectron holography has promoted the need for larger photoelectron diffraction data sets in order to improve the quality of real-space reconstructed images (by suppressing transformational artifacts and distortions). The two main experimental and theoretical approaches to holography, the transform of angular distribution patterns for a coarse selection of energies or the transform of energy-scanned profiles for several directions, represent two limits to k-space sampling. The high brightness of third-generation soft x-ray synchrotron sources provides the opportunity to rapidly measure large high-density x-ray photoelectron diffraction (XPD) data sets with approximately uniform k-space sampling. In this abstract, the authors present such a photoelectron data set acquired for Cu 3p emission from Cu(001). Cu(001) is one of the most well-studied systems for understanding photoelectron diffraction structure and for testing photoelectron holography methods. Cu(001) was chosen for this study in part due to the relatively inert and unreconstructed clean surface, and it served to calibrate and fine-tune the operation of a new synchrotron beamline, electron spectrometer and sample goniometer. In addition to Cu, similar open-quotes volumeclose quotes XPD data sets have been acquired for bulk and surface core-level emission from W(110), from reconstructed Si(100) and Si(111) surfaces, and from the adsorbate system of c(2x2) Mn/Ni(100)

Neutron diffraction from holographic gratings in PMMA

International Nuclear Information System (INIS)

Havermeyer, F.; Kraetzig, E.; Rupp, R.A.; Schubert, D.W.

1999-01-01

Complete text of publication follows. By definition photorefractive materials change the refractive index for light under the action of light. Using the spatially modulated light intensity pattern from the interference of two plane waves, volume phase gratings with accurately defined spacings can be produced. Depending on the material there are many physical origins for these gratings, but in most cases they are linked to a density modulation and, consequently, to a refractive index grating for neutrons. By diffraction of light or neutrons from such gratings even small refractive index changes down to Δn ∼ 10 -7 - 10 -9 can be measured. In our photopolymer system PMMA/MMA (poly(methyl methacrylate) with a content of 10-20% of the residual monomer methyl methacrylate) inhomogeneous illumination leads to local post-polymerisation processes of the residual monomer. The resulting light-optical refractive index grating is caused by the modulation of the monomer/polymer ratio as well as by the modulation of the total density. Only by the unique combination of methods for light and neutron diffraction, available at HOLONS (Holography and Neutron Scattering, instrument at the GKSS research centre), both contributions can be separated. We discuss the angular dependence of the neutron diffraction efficiency for weakly and strongly (efficiencies up to 60% have been achieved) modulated gratings and propose a simple model for the evaluation of the gratings. (author)

Geometrical characterization of micro-optical cylindrical lens arrays using angular resolved diffraction

DEFF Research Database (Denmark)

Iversen, Theis Faber Quist; Hanson, Steen Grüner

2010-01-01

been shown (Iversen et al 2009 J. Opt. A: Pure Appl. Opt. 11 054014 (6pp), B¨uttner and Zeitner 2002 Appl. Opt. 41 6841 8) that the average radius of curvature of an MLA structure can be extracted by observing the far-field diffraction pattern intensity distribution obtained from illumination....... By scanning the angle of incidence of the coherent illumination and simultaneously observing the diffracted intensity, information about the grating period and the radius of curvature can be extracted. The method is implemented with emphasis on further development for compact, high-speed dedicated systems. We...

Refinement of the ferri and paramagnetic phases of magnetite measured by neutron multiple diffraction

International Nuclear Information System (INIS)

Mazzochi, V.L.; Parente, C.B.R.

1989-10-01

Structural parameters of the ferri and paramagnetic phases of magnetite have been refined from neutron multiple diffraction data. Experimental patterns were obtained by measuring the III primary reflection of a natural single crystal of this compound, at room temperature for the ferrimagnetic phase and 703 0 C for the paramagnetic phase. Theoretical multiple diffraction patterns for both phases have been calculated by the program MULTI which uses the iterative method. In this method intensities are caluclated as Taylor series expansions summed up to a order sufficient for a good approximation. A step by step process has been used in the refinements similarly to the parameter-shift method. Final values for the discrepancy factor found for the ferri and paramagnetic phases were R = 3.96% and R = 3.46%, respectively. (author) [pt

X-ray diffraction on nanoparticles chromium and nickel oxides obtained by gelatin using synchrotron radiation

International Nuclear Information System (INIS)

Menezes, Alan Silva de; Medeiros, Angela Maria de Lemos; Miranda, Marcus Aurelio Ribeiro; Almeida, Juliana Marcela Abraao; Remedios, Claudio Marcio Rocha; Silva, Lindomar R.D. da; Gouveia, S.T.; Sasaki, Jose Marcos; Jardim, P.M.

2003-01-01

Full text: Cr 2 O 3 nanoparticles has many applications like green pigments, wear resistance, and coating materials for thermal protection. Several methods to produce chromium oxide nanoparticles have already been studied, gas condensation, laser induced pyrolysis, microwave plasma, sol-gel and gamma radiation methods. Many applications for this kind of material can be provide concerning the particle size. For instance, particle size approximately of 200 nm are preferable as pigment due to its opacity and below 50 nm can be used as transparent pigment. In this work we have demonstrated that chromium and nickel oxide nanoparticles can be prepared by gelatin method. X-Ray diffraction (XRD) show that mean particle size for chromium oxide of 15-150 nm and nickel oxide of 90 nm were obtained for several temperature of sintering. The X-Ray powder diffraction pattern were performed using Synchrotron Radiation X-Ray source at XRD1 beamline in National Laboratory of Light Synchrotron (LNLS). (author)

Diffraction at TOTEM

OpenAIRE

Antchev, G.; Aspell, P.; Avati, V.; Bagliesi, M.G.; Berardi, V.; Berretti, M.; Bottigli, U.; Bozzo, M.; Brucken, E.; Buzzo, A.; Cafagna, F.; Calicchio, M.; Catanesi, M.G.; Catastini, P.L.; Cecchi, R.

2008-01-01

The TOTEM experiment at the LHC measures the total proton-proton cross section with the luminosity-independent method and the elastic proton-proton cross-section over a wide |t|-range. It also performs a comprehensive study of diffraction, spanning from cross-section measurements of individual diffractive processes to the analysis of their event topologies. Hard diffraction will be studied in collaboration with CMS taking advantage of the large common rapidity coverage for charged and neutral...

X-ray scattering and diffraction from Xe-induced ripples in crystalline silicon

Energy Technology Data Exchange (ETDEWEB)

Biermanns, Andreas; Pietsch, Ullrich; Grigorian, Souren [Universitaet Siegen (Germany); Grenzer, Joerg; Facsko, Stefan; Hanisch, Antje [Foschungszentrum Dresden-Rossendorf (Germany); Carbone, Dina; Metzger, Hartmut [ID Beamline, ESRF (France)

2008-07-01

The formation of surface-nanostructures with a characteristic size ranging from several nanometer up to microns has attracted significant interest in the last decades in the context of fabrication of novel opto-electronic and storage devices. One kind of those nanostructures are wave-like patterns (ripples) produced by an interplay between a roughening process caused by ion beam erosion (sputtering) of the surface and smoothening processes caused by surface diffusion. In this contribution we report on investigations of patterned Si(001) surfaces after irradiation with Xe{sup +}-ions using ion-energies up to 40 keV. During the sputtering, an amorphous surface-layer is formed followed by a rather sharp interface towards crystalline material, showing the same morphology as the surface. The structures of the amorphous layer and the amorphous-crystalline interface were studied by means of grazing-incidence-small angle scattering (GISAXS) and diffraction (GID) using synchrotron-radiation. We found that the crystal structure at the interface is expanded along the ripples, caused by the creation of defects inside the surface region, whereas this expansion is strongly reduced across the ripples. This different relaxation may play a driving role in pattern formation at the interface.

Qualitative analysis of powder x-ray diffraction data

International Nuclear Information System (INIS)

Raftery, T.

1999-01-01

Full text: The main task of qualitative analysis is the determination of the presence of major, minor and if practical trace phases in a sample. The attainment of this goal is dependent on the quality of alignment (line position and intensity) as well as quality of sample preparation. Identification is generally on the basis of structure and dependent on the use of reference patterns. There are inherent limitations to the use of reference patterns including lack of reference patterns for the phase of interest (rare), solid solutions or substitutions (likely) and poor quality of reference patterns (unusual). With multiphase samples, there are the added problems of line overlap or interference, determining minor or trace phases in the presence of major phases, the decrease of intensity with concentration and influence of mass absorption on intensities. Within multiphase samples there may be many phases, some of which are in low abundance. It is sometimes possible (and usually desirable) to fractionate the sample by some physical or chemical method (while attempting not to create new phases as a result). It is usually important and often critical to have available supplementary information about the sample - either chemical or physical, or a history of preparation or formation. A central issue is what constitutes a match. A match is an adequate accounting of the distribution of intensity in the diffraction pattern. The match can be thought of in terms of a sum of δ2θ (or δd/d) and/or δI/I ref , and the consistency with known information. The calculated measures give rise to the figures of merit (FOM) of search match programs. It must always be remembered that two compounds of the same space group and similar cell parameters (eg. FCC metals) are going to have very similar diffraction patterns - any search/match technique usually arrives at a stage where there is a list of possibilities that must be decided between. The range search-match techniques span manual

Highlighting material structure with transmission electron diffraction correlation coefficient maps.

Science.gov (United States)

Kiss, Ákos K; Rauch, Edgar F; Lábár, János L

2016-04-01

Correlation coefficient maps are constructed by computing the differences between neighboring diffraction patterns collected in a transmission electron microscope in scanning mode. The maps are shown to highlight material structural features like grain boundaries, second phase particles or dislocations. The inclination of the inner crystal interfaces are directly deduced from the resulting contrast. Copyright © 2016 Elsevier B.V. All rights reserved.

Probing diffractive production of gauge bosons at forward rapidities

Energy Technology Data Exchange (ETDEWEB)

Basso, Eduardo; Rangel, Murilo S. [Universidade Federal do Rio de Janeiro, Instituto de Fisica, Caixa Postal 68528, Rio de Janeiro, RJ (Brazil); Goncalves, Victor P. [Universidade Federal de Pelotas, Instituto de Fisica e Matematica, Pelotas, RS (Brazil)

2016-12-15

Gauge boson production at forward rapidities in single diffractive events at the LHC is investigated considering pp collisions at √(s) = 8 and 13 TeV. The impact of gap survival effects is analysed using two different models for the soft rescattering contributions. We demonstrate that using the forward shower counter Project at LHCb-HERSCHEL, together with the Vertex Locator-VELO, it is possible to discriminate diffractive production of the gauge bosons W and Z from the non-diffractive processes and studies of the Pomeron structure and diffraction phenomenology are feasible. Moreover, we show that the analysis of this process can be useful to constrain the modelling of the gap survival effects. (orig.)

Diffraction of stochastic electromagnetic fields by a hole in a thin film with real optical properties

Science.gov (United States)

Dorofeyev, Illarion

2008-08-01

The classical Kirchhoff theory of diffraction is extended to the case of real optical properties of a screen and its finite thickness. A spectral power density of diffracted electromagnetic fields by a hole in a thin film with real optical properties was calculated. The problem was solved by use of the vector Green theorems and related Green function of the boundary value problem. A spectral and spatial selectivity of the considered system was demonstrated. Diffracted patterns were calculated for the coherent and incoherent incident fields in case of holes array in a screen of perfect conductivity.

Diffraction of stochastic electromagnetic fields by a hole in a thin film with real optical properties

International Nuclear Information System (INIS)

Dorofeyev, Illarion

2008-01-01

The classical Kirchhoff theory of diffraction is extended to the case of real optical properties of a screen and its finite thickness. A spectral power density of diffracted electromagnetic fields by a hole in a thin film with real optical properties was calculated. The problem was solved by use of the vector Green theorems and related Green function of the boundary value problem. A spectral and spatial selectivity of the considered system was demonstrated. Diffracted patterns were calculated for the coherent and incoherent incident fields in case of holes array in a screen of perfect conductivity

Critical voltage effects in electron channeling patterns

International Nuclear Information System (INIS)

Farrow, R.C.

1984-01-01

Electron channeling patterns were used to study critical voltage effects in the metals molybdenum and tungsten. The purpose was to characterize both theoretically and experimentally how a critical voltage will affect the channeling pattern line shapes. The study focused on the second order critical voltage that results from the degeneracy between the Bloch wave states of the (110) and (220) reflections. Theoretical (110) series electron channeling pattern line profiles were calculated using the dynamical theory of Hirsch and Humphreys (1970). A 10 beam dynamical electron diffraction calculation was performed (using complex Fourier lattice potentials) to generate Bloch wave coefficients, excitation amplitudes, and absorption coefficients needed for determining backscattering coefficients and subsequent backscattered electron intensities. The theoretical model is applicable to electron diffraction at all energies since no high energy approximation or perturbation method was used

Study of UO2 mechanical behaviour implanted with helium ions using X-ray micro-diffraction and mechanical modeling

International Nuclear Information System (INIS)

Ibrahim, Marcelle

2015-01-01

In order to study the mechanical behavior of nuclear fuel during direct long term storage, UO 2 polycrystals were implanted with Helium ions at a thin surface layer (1 μm approximately), which leads to stress and strain fields in the layer. Strains were measured, at the grains scale, by X-ray micro-diffraction, using synchrotron radiation (ESRF). Image analysis methods were developed for an automatic analysis of the large number of diffraction patterns. Applying statistical tools to Laue patterns allows an automatic detection of low quality images, and enhances the measurement precision. At low layer thickness, the mechanical interaction between grains can be neglected. At higher thickness, experimental results showed a higher mechanical interaction near grain boundaries that can be modeled using finite elements method. Geostatistical tools were used to quantify these interactions. The swelling and the elastic constants in the implanted layer can be estimated through the measured strains on a large number of grains with different orientations. This work allows the determination of the swelling of nuclear fuel in irradiation conditions, as well as the modification of its elastic properties. (author) [fr

Diffraction at TOTEM

OpenAIRE

Giani, S; Niewiadomski, H; Antchev, G; Aspell, P; Avati, V; Bagliesi, M G; Berardi, V; Berretti, M; Besta, M; Bozzo, M; Brücken, E; Buzzo, A; Cafagna, F; Calicchio, M; Catanesi, M G

2010-01-01

The primary objective of the TOTEM experiment at the LHC is the measurement of the total proton-proton cross section with the luminosity-independent method and the study of elastic proton-proton cross-section over a wide |t|-range. In addition TOTEM also performs a comprehensive study of diffraction, spanning from cross-section measurements of individual diffractive processes to the analysis of their event topologies. Hard diffraction will be studied in collaboration with CMS taking advantage...

Multi-wavelength speckle reduction for laser pico-projectors using diffractive optics

Science.gov (United States)

Thomas, Weston H.

Personal electronic devices, such as cell phones and tablets, continue to decrease in size while the number of features and add-ons keep increasing. One particular feature of great interest is an integrated projector system. Laser pico-projectors have been considered, but the technology has not been developed enough to warrant integration. With new advancements in diode technology and MEMS devices, laser-based projection is currently being advanced for pico-projectors. A primary problem encountered when using a pico-projector is coherent interference known as speckle. Laser speckle can lead to eye irritation and headaches after prolonged viewing. Diffractive optical elements known as diffusers have been examined as a means to lower speckle contrast. Diffusers are often rotated to achieve temporal averaging of the spatial phase pattern provided by diffuser surface. While diffusers are unable to completely eliminate speckle, they can be utilized to decrease the resultant contrast to provide a more visually acceptable image. This dissertation measures the reduction in speckle contrast achievable through the use of diffractive diffusers. A theoretical Fourier optics model is used to provide the diffuser's stationary and in-motion performance in terms of the resultant contrast level. Contrast measurements of two diffractive diffusers are calculated theoretically and compared with experimental results. In addition, a novel binary diffuser design based on Hadamard matrices will be presented. Using two static in-line Hadamard diffusers eliminates the need for rotation or vibration of the diffuser for temporal averaging. Two Hadamard diffusers were fabricated and contrast values were subsequently measured, showing good agreement with theory and simulated values. Monochromatic speckle contrast values of 0.40 were achieved using the Hadamard diffusers. Finally, color laser projection devices require the use of red, green, and blue laser sources; therefore, using a

Performance improvements of binary diffractive structures via optimization of the photolithography and dry etch processes

Science.gov (United States)

Welch, Kevin; Leonard, Jerry; Jones, Richard D.

2010-08-01

Increasingly stringent requirements on the performance of diffractive optical elements (DOEs) used in wafer scanner illumination systems are driving continuous improvements in their associated manufacturing processes. Specifically, these processes are designed to improve the output pattern uniformity of off-axis illumination systems to minimize degradation in the ultimate imaging performance of a lithographic tool. In this paper, we discuss performance improvements in both photolithographic patterning and RIE etching of fused silica diffractive optical structures. In summary, optimized photolithographic processes were developed to increase critical dimension uniformity and featuresize linearity across the substrate. The photoresist film thickness was also optimized for integration with an improved etch process. This etch process was itself optimized for pattern transfer fidelity, sidewall profile (wall angle, trench bottom flatness), and across-wafer etch depth uniformity. Improvements observed with these processes on idealized test structures (for ease of analysis) led to their implementation in product flows, with comparable increases in performance and yield on customer designs.

Surface structure of Bi2Sr2CaCu2O(8+delta) high-temperature superconductors studied using low-energy electron diffraction

Science.gov (United States)

Lindberg, P. A. P.; Shen, Z.-X.; Wells, B. O.; Mitzi, D. B.; Lindau, I.

1988-12-01

The surface structure of Bi2Sr2CaCu2O(8+delta) has been studied using low-energy electron diffraction (LEED). Sharp diffraction spots indicative of a well-ordered surface are observed. The LEED patterns unequivocally show that this type of material preferentially cleaves along the a-b planes of the nearly tetragonal unit cell. A superstructure extending along one of the axes in the a-b plane (b) is found to have a periodicity of 27 + or - 0.5 A, in good agreement with earlier studies of the three-dimensional crystal structure. The superstructure at the surface is nonlocal in character and reflects the long-range superlattice of the bulk along the b axis. Intensity modulations of the diffraction spots oriented along the b axis are also reported and discussed in terms of the cell dimension of the unit cell along the b axis.

Dynamical electron diffraction simulation for non-orthogonal crystal system by a revised real space method.

Science.gov (United States)

Lv, C L; Liu, Q B; Cai, C Y; Huang, J; Zhou, G W; Wang, Y G

2015-01-01

In the transmission electron microscopy, a revised real space (RRS) method has been confirmed to be a more accurate dynamical electron diffraction simulation method for low-energy electron diffraction than the conventional multislice method (CMS). However, the RRS method can be only used to calculate the dynamical electron diffraction of orthogonal crystal system. In this work, the expression of the RRS method for non-orthogonal crystal system is derived. By taking Na2 Ti3 O7 and Si as examples, the correctness of the derived RRS formula for non-orthogonal crystal system is confirmed by testing the coincidence of numerical results of both sides of Schrödinger equation; moreover, the difference between the RRS method and the CMS for non-orthogonal crystal system is compared at the accelerating voltage range from 40 to 10 kV. Our results show that the CMS method is almost the same as the RRS method for the accelerating voltage above 40 kV. However, when the accelerating voltage is further lowered to 20 kV or below, the CMS method introduces significant errors, not only for the higher-order Laue zone diffractions, but also for zero-order Laue zone. These indicate that the RRS method for non-orthogonal crystal system is necessary to be used for more accurate dynamical simulation when the accelerating voltage is low. Furthermore, the reason for the increase of differences between those diffraction patterns calculated by the RRS method and the CMS method with the decrease of the accelerating voltage is discussed. © 2015 The Authors Journal of Microscopy © 2015 Royal Microscopical Society.

Angle-resolved diffraction grating biosensor based on porous silicon

Energy Technology Data Exchange (ETDEWEB)

Lv, Changwu; Li, Peng [School of Physical Science and Technology, Xinjiang University, Urumqi 830046 (China); Jia, Zhenhong, E-mail: jzhh@xju.edu.cn; Liu, Yajun; Mo, Jiaqing; Lv, Xiaoyi [College of Information Science and Engineering, Xinjiang University, Urumqi 830046 (China)

2016-03-07

In this study, an optical biosensor based on a porous silicon composite structure was fabricated using a simple method. This structure consists of a thin, porous silicon surface diffraction grating and a one-dimensional porous silicon photonic crystal. An angle-resolved diffraction efficiency spectrum was obtained by measuring the diffraction efficiency at a range of incident angles. The angle-resolved diffraction efficiency of the 2nd and 3rd orders was studied experimentally and theoretically. The device was sensitive to the change of refractive index in the presence of a biomolecule indicated by the shift of the diffraction efficiency spectrum. The sensitivity of this sensor was investigated through use of an 8 base pair antifreeze protein DNA hybridization. The shifts of the angle-resolved diffraction efficiency spectrum showed a relationship with the change of the refractive index, and the detection limit of the biosensor reached 41.7 nM. This optical device is highly sensitive, inexpensive, and simple to fabricate. Using shifts in diffraction efficiency spectrum to detect biological molecules has not yet been explored, so this study establishes a foundation for future work.

High resolution electron microscopy and electron diffraction of YBa/sub 2/Cu/sub 3/O/sub 7-x/

International Nuclear Information System (INIS)

Krakow, W.; Shaw, T.M.

1988-01-01

Experimental high resolution electron micrographs and computer simulation experiments have been used to evaluate the visibility of the atomic constituents of YBa/sub 2/Cu/sub 3/O/sub 7-x/. In practice, the detection of oxygen has not been possible in contradiction to that predicted by modelling of perfect crystalline material. Preliminary computer experiments of the electron diffraction patterns when oxygen vacancies are introduced on the Cu-O sheets separating Ba layers show the diffuse streaks characteristic of short range ordering

Polarization-dependent diffraction in all-dielectric, twisted-band structures

Energy Technology Data Exchange (ETDEWEB)

Kardaś, Tomasz M.; Jagodnicka, Anna; Wasylczyk, Piotr, E-mail: pwasylcz@fuw.edu.pl [Photonic Nanostructure Facility, Institute of Experimental Physics, Faculty of Physics, University of Warsaw, Pasteura 5, 02-093 Warszawa (Poland)

2015-11-23

We propose a concept for light polarization management: polarization-dependent diffraction in all-dielectric microstructures. Numerical simulations of light propagation show that with an appropriately configured array of twisted bands, such structures may exhibit zero birefringence and at the same time diffract two circular polarizations with different efficiencies. Non-birefringent structures as thin as 3 μm have a significant difference in diffraction efficiency for left- and right-hand circular polarizations. We identify the structural parameters of such twisted-band matrices for optimum performance as circular polarizers.

Coherent Diffractive Imaging at LCLS

Science.gov (United States)

Schulz, Joachim

2010-03-01

Soft x-ray FEL light sources produce ultrafast x-ray pulses with outstanding high peak brilliance. This might enable the structure determination of proteins that cannot be crystallized. The deposited energy would destroy the molecules completely, but owing to the short pulses the destruction will ideally only happen after the termination of the pulse. In order to address the many challenges that we face in attempting molecular diffraction, we have carried out experiments in coherent diffraction from protein nanocrystals at the Linac Coherent Light Source (LCLS) at SLAC. The periodicity of these objects gives us much higher scattering signals than uncrystallized proteins would. The crystals are filtered to sizes less than 2 micron, and delivered to the pulsed X-ray beam in a liquid jet. The effects of pulse duration and fluence on the high-resolution structure of the crystals have been studied. Diffraction patterns are recorded at a repetition rate of 30 Hz with pnCCD detectors. This allows us to take 108,000 images per hour. With 2-mega-pixel-detectors this gives a data-rate of more than 400 GB per hour. The automated sorting and evaluation of hundreds of thousands images is another challenge of this kind of experiments. Preliminary results will be presented on our first LCLS experiments. This work was carried out as part of a collaboration, for which Henry Chapman is the spokesperson. The collaboration consists of CFEL DESY, Arizona State University, SLAC, Uppsala University, LLNL, The University of Melbourne, LBNL, the Max Planck Institute for Medical Research, and the Max Planck Advanced Study Group (ASG) at the CFEL. The experiments were carried out using the CAMP apparatus, which was designed and built by the Max Planck ASG at CFEL. The LCLS is operated by Stanford University on behalf of the U.S. Department of Energy, Office of Basic Energy Sciences.

Accurate Antenna Models in Ground Penetrating Radar Diffraction Tomography

DEFF Research Database (Denmark)

Meincke, Peter; Kim, Oleksiy S.

2002-01-01

are modeled by their plane-wave receiving and transmitting spectra. We find these spectra numerically for a resistively loaded dipole using the method of moments. Also, we illustrate, through a numerical example, the importance of taking into account the correct antenna pattern in GPR diffraction tomography.......Linear inversion schemes based on the concept of diffraction tomography have proven successful for ground penetrating radar (GPR) imaging. In many GPR surveys, the antennas of the GPR are located close to the air-soil interface and, therefore, it is important to incorporate the presence...... of this interface in the inversion scheme (see Hansen, T.B. and Meincke Johansen, P., IEEE Trans. Geoscience and Remote Sensing, vol.38, p.496-506, 2000). Hansen and Meincke Johansen modeled the antennas as ideal (Hertzian) electric dipoles. Since practical GPR antennas are not ideal, it is of interest...

Gastric cancers of Western European and African patients show different patterns of genomic instability

Directory of Open Access Journals (Sweden)

Mulder Chris JJ

2011-01-01

Full Text Available Abstract Background Infection with H. pylori is important in the etiology of gastric cancer. Gastric cancer is infrequent in Africa, despite high frequencies of H. pylori infection, referred to as the African enigma. Variation in environmental and host factors influencing gastric cancer risk between different populations have been reported but little is known about the biological differences between gastric cancers from different geographic locations. We aim to study genomic instability patterns of gastric cancers obtained from patients from United Kingdom (UK and South Africa (SA, in an attempt to support the African enigma hypothesis at the biological level. Methods DNA was isolated from 67 gastric adenocarcinomas, 33 UK patients, 9 Caucasian SA patients and 25 native SA patients. Microsatellite instability and chromosomal instability were analyzed by PCR and microarray comparative genomic hybridization, respectively. Data was analyzed by supervised univariate and multivariate analyses as well as unsupervised hierarchical cluster analysis. Results Tumors from Caucasian and native SA patients showed significantly more microsatellite instable tumors (p Conclusions Gastric cancers from SA and UK patients show differences in genetic instability patterns, indicating possible different biological mechanisms in patients from different geographical origin. This is of future clinical relevance for stratification of gastric cancer therapy.

Coherent patterning of matter waves with subwavelength localization

International Nuclear Information System (INIS)

Mompart, J.; Ahufinger, V.; Birkl, G.

2009-01-01

We propose the subwavelength localization via adiabatic passage (SLAP) technique to coherently achieve state-selective patterning of matter waves well beyond the diffraction limit. The SLAP technique consists in coupling two partially overlapping and spatially structured laser fields to three internal levels of the matter wave yielding state-selective localization at those positions where the adiabatic passage process does not occur. We show that by means of this technique matter wave localization down to the single nanometer scale can be achieved. We analyze in detail the potential implementation of the SLAP technique for nanolithography with an atomic beam of metastable Ne* and for coherent patterning of a two-component 87 Rb Bose-Einstein condensate.

Parameter-free extraction of EMCD from an energy-filtered diffraction datacube using multivariate curve resolution

International Nuclear Information System (INIS)

Muto, S.; Tatsumi, K.; Rusz, J.

2013-01-01

We present a parameter-free method of extraction of the electron magnetic circular dichroism spectra from energy-filtered diffraction patterns measured on a crystalline specimen. The method is based on a multivariate curve resolution technique. The main advantage of the proposed method is that it allows extraction of the magnetic signal regardless of the symmetry and orientation of the crystal, as long as there is a sufficiently strong magnetic component of the signal in the diffraction plane. This method essentially overcomes difficulties in extraction of the EMCD signal caused by complexity of dynamical diffraction effects. - Highlights: ► New method of extraction of EMCD signal using statistical methods (multivariate curve resolution). ► EMCD can be extracted quantitatively regardless of symmetry of crystal or its orientation. ► First principles simulation of EFDIF datacube, including dynamical diffraction effects

Contribution to diffraction theory; Contribution a la theorie de la diffraction

Energy Technology Data Exchange (ETDEWEB)

Chako, N [Commissariat a l' Energie Atomique, Saclay (France). Centre d' Etudes Nucleaires

1966-11-01

In a first part, we have given a general and detailed treatment of the modern theory of diffraction. The rigorous theory is formulated as a boundary value problem of the wave equation or Maxwell equations. However, up to the present time, such a program of treating diffraction by optical systems, even for simple optical instruments, has not been realized due to the complicated character of the boundary conditions. The recent developments show clearly the nature of the approximation of the classical theories originally due to Fresnel and Young, later formulated in a rigorous manner by Kirchhoff and Rubinowicz, respectively and, at the same time the insufficiency of these theories in explaining a number of diffraction phenomena. Furthermore, we have made a study of the limitations of the approximate theories and the recent attempts to improve these. The second part is devoted to a general mathematical treatment of the theory of diffraction of optical systems including aberrations. After a general and specific analysis of geometrical and wave aberrations along classical and modern (Nijboer) lines, we have been able to evaluate the diffraction integrals representing the image field at any point in image space explicitly, when the aberrations are small. Our formulas are the generalisations of all anterior results obtained by previous investigators. Moreover, we have discussed the Zernike-Nijboer theory of aberration and generalised it not only for rotational systems, but also for non-symmetric systems as well, including the case of non circular apertures. The extension to non-circular apertures is done by introducing orthogonal functions or polynomials over such aperture shapes. So far the results are valid for small aberrations, that is to say, where the deformation of the real wave front emerging from the optical system is less than a wave length of light or of the electromagnetic wave from the ideal wave front. If the aberrations are large, then one must employ the

Contribution to diffraction theory; Contribution a la theorie de la diffraction

Energy Technology Data Exchange (ETDEWEB)

Chako, N. [Commissariat a l' Energie Atomique, Saclay (France). Centre d' Etudes Nucleaires

1966-11-01

In a first part, we have given a general and detailed treatment of the modern theory of diffraction. The rigorous theory is formulated as a boundary value problem of the wave equation or Maxwell equations. However, up to the present time, such a program of treating diffraction by optical systems, even for simple optical instruments, has not been realized due to the complicated character of the boundary conditions. The recent developments show clearly the nature of the approximation of the classical theories originally due to Fresnel and Young, later formulated in a rigorous manner by Kirchhoff and Rubinowicz, respectively and, at the same time the insufficiency of these theories in explaining a number of diffraction phenomena. Furthermore, we have made a study of the limitations of the approximate theories and the recent attempts to improve these. The second part is devoted to a general mathematical treatment of the theory of diffraction of optical systems including aberrations. After a general and specific analysis of geometrical and wave aberrations along classical and modern (Nijboer) lines, we have been able to evaluate the diffraction integrals representing the image field at any point in image space explicitly, when the aberrations are small. Our formulas are the generalisations of all anterior results obtained by previous investigators. Moreover, we have discussed the Zernike-Nijboer theory of aberration and generalised it not only for rotational systems, but also for non-symmetric systems as well, including the case of non circular apertures. The extension to non-circular apertures is done by introducing orthogonal functions or polynomials over such aperture shapes. So far the results are valid for small aberrations, that is to say, where the deformation of the real wave front emerging from the optical system is less than a wave length of light or of the electromagnetic wave from the ideal wave front. If the aberrations are large, then one must employ the

Diffraction at TOTEM

CERN Document Server

Giani, S; Antchev, G; Aspell, P; Avati, V; Bagliesi, M G; Berardi, V; Berretti, M; Besta, M; Bozzo, M; Brücken, E; Buzzo, A; Cafagna, F; Calicchio, M; Catanesi, M G; Cecchi, R; Ciocci, M A; Dadel, P; Deile, M; Dimovasili, E; Eggert, K; Eremin, V; Ferro, F; Fiergolski, A; García, F; Greco, V; Grzanka, L; Heino, J; Hildén, T; Kaspar, J; Kopal, J; Kundrát, V; Kurvinen, K; Lami, S; Latino, G; Lauhakangas, R; Leszko, R; Lippmaa, E; Lokajícek, M; Lo Vetere, M; Lucas Rodriguez, F; Macrí, M; Magazzù, G; Meucci, M; Minutoli, S; Notarnicola, G; Oliveri, E; Oljemark, F; Orava, R; Oriunno, M; Österberg, K; Pedreschi, E; Petäjäjärvi, J; Prochazka, J; Quinto, M; Radermacher, E; Radicioni, E; Ravotti, F; Rella, G; Robutti, E; Ropelewski, L; Rostkowski, M; Ruggiero, G; Rummel, A; Saarikko, H; Sanguinetti, G; Santroni, A; Scribano, A; Sette, G; Snoeys, W; Spinella, F; Ster, A; Taylor, C; Trummal, A; Turini, N; Whitmore, J; Wu, J; Zalewski, M

2010-01-01

The primary objective of the TOTEM experiment at the LHC is the measurement of the total proton-proton cross section with the luminosity-independent method and the study of elastic proton-proton cross-section over a wide |t|-range. In addition TOTEM also performs a comprehensive study of diffraction, spanning from cross-section measurements of individual diffractive processes to the analysis of their event topologies. Hard diffraction will be studied in collaboration with CMS taking advantage of the large common rapidity coverage for charged and neutral particle detection and the large variety of trigger possibilities even at large luminosities. TOTEM will take data under all LHC beam conditions including standard high luminosity runs to maximise its physics reach. This contribution describes the main features of the TOTEM diffractive physics programme including measurements to be made in the early LHC runs.