WorldWideScience

Sample records for diffraction pattern applying

  1. Quantitative analysis of crystalline pharmaceuticals in tablets by pattern-fitting procedure using X-ray diffraction pattern.

    Science.gov (United States)

    Takehira, Rieko; Momose, Yasunori; Yamamura, Shigeo

    2010-10-15

    A pattern-fitting procedure using an X-ray diffraction pattern was applied to the quantitative analysis of binary system of crystalline pharmaceuticals in tablets. Orthorhombic crystals of isoniazid (INH) and mannitol (MAN) were used for the analysis. Tablets were prepared under various compression pressures using a direct compression method with various compositions of INH and MAN. Assuming that X-ray diffraction pattern of INH-MAN system consists of diffraction intensities from respective crystals, observed diffraction intensities were fitted to analytic expression based on X-ray diffraction theory and separated into two intensities from INH and MAN crystals by a nonlinear least-squares procedure. After separation, the contents of INH were determined by using the optimized normalization constants for INH and MAN. The correction parameter including all the factors that are beyond experimental control was required for quantitative analysis without calibration curve. The pattern-fitting procedure made it possible to determine crystalline phases in the range of 10-90% (w/w) of the INH contents. Further, certain characteristics of the crystals in the tablets, such as the preferred orientation, size of crystallite, and lattice disorder were determined simultaneously. This method can be adopted to analyze compounds whose crystal structures are known. It is a potentially powerful tool for the quantitative phase analysis and characterization of crystals in tablets and powders using X-ray diffraction patterns. Copyright 2010 Elsevier B.V. All rights reserved.

  2. X-ray diffraction from ideal mosaic crystals in external fields of certain types. I. Atomic displacements and the corresponding diffraction patterns

    International Nuclear Information System (INIS)

    Treushnikov, E.N.

    2000-01-01

    The problem of the theoretical description of X-ray diffraction from ideal mosaic crystals under the effect of various external fields has been formulated. Electric, magnetic, electromagnetic, and acoustic perturbations are considered. The atomic displacements in crystals under the effect of external fields and the types of the corresponding diffraction patterns are analyzed for various types of perturbations. The crystal classes are determined in which atomic displacements can be recorded experimentally. Diffraction patterns formed under the effect of various external factors are considered on the basis of the derived dependence of the structure factor on the characteristics of an applied force field

  3. Diffractive elements for generating microscale laser beam patterns: a Y2K problem

    Science.gov (United States)

    Teiwes, Stephan; Krueger, Sven; Wernicke, Guenther K.; Ferstl, Margit

    2000-03-01

    Lasers are widely used in industrial fabrication for engraving, cutting and many other purposes. However, material processing at very small scales is still a matter of concern. Advances in diffractive optics could provide for laser systems that could be used for engraving or cutting of micro-scale patterns at high speeds. In our paper we focus on the design of diffractive elements which can be used for this special application. It is a common desire in material processing to apply 'discrete' as well as 'continuous' beam patterns. Especially, the latter case is difficult to handle as typical micro-scale patterns are characterized by bad band-limitation properties, and as speckles can easily occur in beam patterns. It is shown in this paper that a standard iterative design method usually fails to obtain diffractive elements that generate diffraction patterns with acceptable quality. Insights gained from an analysis of the design problems are used to optimize the iterative design method. We demonstrate applicability and success of our approach by the design of diffractive phase elements that generate a discrete and a continuous 'Y2K' pattern.

  4. Computer Simulation of Diffraction Patterns.

    Science.gov (United States)

    Dodd, N. A.

    1983-01-01

    Describes an Apple computer program (listing available from author) which simulates Fraunhofer and Fresnel diffraction using vector addition techniques (vector chaining) and allows user to experiment with different shaped multiple apertures. Graphics output include vector resultants, phase difference, diffraction patterns, and the Cornu spiral…

  5. Calculation of Debye-Scherrer diffraction patterns from highly stressed polycrystalline materials

    Energy Technology Data Exchange (ETDEWEB)

    MacDonald, M. J., E-mail: macdonm@umich.edu [Applied Physics Program, University of Michigan, Ann Arbor, Michigan 48109 (United States); SLAC National Accelerator Laboratory, Menlo Park, California 94025 (United States); Vorberger, J. [Helmholtz Zentrum Dresden-Rossendorf, 01328 Dresden (Germany); Gamboa, E. J.; Glenzer, S. H.; Fletcher, L. B. [SLAC National Accelerator Laboratory, Menlo Park, California 94025 (United States); Drake, R. P. [Climate and Space Sciences and Engineering, Applied Physics, and Physics, University of Michigan, Ann Arbor, Michigan 48109 (United States)

    2016-06-07

    Calculations of Debye-Scherrer diffraction patterns from polycrystalline materials have typically been done in the limit of small deviatoric stresses. Although these methods are well suited for experiments conducted near hydrostatic conditions, more robust models are required to diagnose the large strain anisotropies present in dynamic compression experiments. A method to predict Debye-Scherrer diffraction patterns for arbitrary strains has been presented in the Voigt (iso-strain) limit [Higginbotham, J. Appl. Phys. 115, 174906 (2014)]. Here, we present a method to calculate Debye-Scherrer diffraction patterns from highly stressed polycrystalline samples in the Reuss (iso-stress) limit. This analysis uses elastic constants to calculate lattice strains for all initial crystallite orientations, enabling elastic anisotropy and sample texture effects to be modeled directly. The effects of probing geometry, deviatoric stresses, and sample texture are demonstrated and compared to Voigt limit predictions. An example of shock-compressed polycrystalline diamond is presented to illustrate how this model can be applied and demonstrates the importance of including material strength when interpreting diffraction in dynamic compression experiments.

  6. Background removal in X-ray fiber diffraction patterns

    International Nuclear Information System (INIS)

    Millane, R.P.; Arnott, S.

    1985-01-01

    Background can be a major source of error in measurement of diffracted intensities in fiber diffraction patterns. Errors can be large when poorly oriented less-crystalline specimens give diffraction patterns with little uncontaminated background. A method for estimating and removing a general global background in such cases is described and illustrated with an example. (orig.)

  7. Development of an ellipse fitting method with which to analyse selected area electron diffraction patterns

    Energy Technology Data Exchange (ETDEWEB)

    Mitchell, D.R.G., E-mail: dmitchel@uow.edu.au [Electron Microscopy Centre, Australian Institute for Innovative Materials, Innovation Campus, University of Wollongong, North Wollongong, NSW 2500 (Australia); Van den Berg, J.A. [Electron Microscopy Centre, Australian Institute for Innovative Materials, Innovation Campus, University of Wollongong, North Wollongong, NSW 2500 (Australia); Catalyst Fundamentals, Fischer-Tropsch and Syngas Conversion Research, Sasol Technology R & D, Sasolburg 1947 (South Africa)

    2016-01-15

    A software method has been developed which uses ellipse fitting to analyse electron diffraction patterns from polycrystalline materials. The method, which requires minimal user input, can determine the pattern centre and the diameter of diffraction rings with sub-pixel precision. This enables accurate crystallographic information to be obtained in a rapid and consistent manner. Since the method fits ellipses, it can detect, quantify and correct any elliptical distortion introduced by the imaging system. Distortion information derived from polycrystalline patterns as a function of camera length can be subsequently recalled and applied to single crystal patterns, resulting in improved precision and accuracy. The method has been implemented as a plugin for the DigitalMicrograph software by Gatan, and is a freely available via the internet. - Highlights: • A robust ellipse fitting method is developed. • Freely available software for automated diffraction pattern analysis is demonstrated. • Measurement and correction of elliptical distortion is routinely achieved.

  8. Simulation of the diffraction pattern of one dimensional quasicrystal ...

    African Journals Online (AJOL)

    In addition, it has been found that each golden mean produces a unique diffraction pattern and that the lower the golden mean the better the diffraction pattern resembles that of a periodic chain. Also the intensity of the central peak was found to decrease as the golden mean increases. However the value of golden mean ...

  9. Lattice constant measurement from electron backscatter diffraction patterns

    DEFF Research Database (Denmark)

    Saowadee, Nath; Agersted, Karsten; Bowen, Jacob R.

    2017-01-01

    Kikuchi bands in election backscattered diffraction patterns (EBSP) contain information about lattice constants of crystallographic samples that can be extracted via the Bragg equation. An advantage of lattice constant measurement from EBSPs over diffraction (XRD) is the ability to perform local ...

  10. Classification using diffraction patterns for single-particle analysis

    International Nuclear Information System (INIS)

    Hu, Hongli; Zhang, Kaiming; Meng, Xing

    2016-01-01

    An alternative method has been assessed; diffraction patterns derived from the single particle data set were used to perform the first round of classification in creating the initial averages for proteins data with symmetrical morphology. The test protein set was a collection of Caenorhabditis elegans small heat shock protein 17 obtained by Cryo EM, which has a tetrahedral (12-fold) symmetry. It is demonstrated that the initial classification on diffraction patterns is workable as well as the real-space classification that is based on the phase contrast. The test results show that the information from diffraction patterns has the enough details to make the initial model faithful. The potential advantage using the alternative method is twofold, the ability to handle the sets with poor signal/noise or/and that break the symmetry properties. - Highlights: • New classification method. • Create the accurate initial model. • Better in handling noisy data.

  11. Classification using diffraction patterns for single-particle analysis

    Energy Technology Data Exchange (ETDEWEB)

    Hu, Hongli; Zhang, Kaiming [Department of Biophysics, the Health Science Centre, Peking University, Beijing 100191 (China); Meng, Xing, E-mail: xmeng101@gmail.com [Wadsworth Centre, New York State Department of Health, Albany, New York 12201 (United States)

    2016-05-15

    An alternative method has been assessed; diffraction patterns derived from the single particle data set were used to perform the first round of classification in creating the initial averages for proteins data with symmetrical morphology. The test protein set was a collection of Caenorhabditis elegans small heat shock protein 17 obtained by Cryo EM, which has a tetrahedral (12-fold) symmetry. It is demonstrated that the initial classification on diffraction patterns is workable as well as the real-space classification that is based on the phase contrast. The test results show that the information from diffraction patterns has the enough details to make the initial model faithful. The potential advantage using the alternative method is twofold, the ability to handle the sets with poor signal/noise or/and that break the symmetry properties. - Highlights: • New classification method. • Create the accurate initial model. • Better in handling noisy data.

  12. Translation symmetry of the Fraunhofer diffraction pattern from a polygonal aperture

    International Nuclear Information System (INIS)

    Vinogradov, I.R.; Tarlykov, V.A.

    1995-01-01

    The problem of observing the translation symmetry in the Fraunhofer diffraction pattern is treated. The objective of this study is to show that translation symmetry can be observed in the Fraunhofer diffraction pattern if the diffraction aperture can be represented in the form of a set of parallelogram apertures. It is shown that the diffraction field produced by such an aperture can be represented as a system of point sources modulated with an amplitude factor. 10 refs., 2 figs

  13. Periodically distributed objects with quasicrystalline diffraction pattern

    Energy Technology Data Exchange (ETDEWEB)

    Wolny, Janusz, E-mail: wolny@fis.agh.edu.pl; Strzalka, Radoslaw [Faculty of Physics and Applied Computer Science, AGH University of Science and Technology, al. Mickiewicza 30, 30-059 Krakow (Poland); Kuczera, Pawel [Faculty of Physics and Applied Computer Science, AGH University of Science and Technology, al. Mickiewicza 30, 30-059 Krakow (Poland); Laboratory of Crystallography, ETH Zurich, Wolfgang-Pauli-Strasse 10, CH-8093 Zurich (Switzerland)

    2015-03-30

    It is possible to construct fully periodically distributed objects with a diffraction pattern identical to the one obtained for quasicrystals. These objects are probability distributions of distances obtained in the statistical approach to aperiodic structures distributed periodically. The diffraction patterns have been derived by using a two-mode Fourier transform—a very powerful method not used in classical crystallography. It is shown that if scaling is present in the structure, this two-mode Fourier transform can be reduced to a regular Fourier transform with appropriately rescaled scattering vectors and added phases. Detailed case studies for model sets 1D Fibonacci chain and 2D Penrose tiling are discussed. Finally, it is shown that crystalline, quasicrystalline, and approximant structures can be treated in the same way.

  14. Diffraction patterns from 7-Angstroms tubular halloysite

    International Nuclear Information System (INIS)

    Eggleton, T.

    1998-01-01

    Full text: The diffraction patterns from 7-Angstroms tubular halloysite are superficially like those from kaolinite. Diffraction from a tubular aggregate of atoms, however, differs from that from a crystal because there is no linear repetition in two of the three conventional crystallographic directions. In tubular halloysite, the tube axis is [010] or [110] and in this direction the unit cell repeats in the normal linear fashion. The x-axis, by contrast, changes direction tangentially around the tube circumference, and there can be no true z-axis, because unit cells in the radial direction do not superimpose, since each successive tubular layer has a larger radius than its predecessor and therefore must contain more unit cells than its predecessor. Because tubular 'crystals' do not have a lattice repeat, use of Bragg 'hkl' indices is not appropriate. In the xy plane, a small area of the structure approximates a flat layer silicate, and hk indices may been used to label diffraction maxima. Similarly, successive 1:1 layers tangential to the tube walls yield a series of apparent 001 diffraction maxima. Measurement of these shows that the d-spacings do not form an exact integral series. The reason for this lies in the curvature of the structure. Calculated electron and powder X-ray diffraction patterns, based on a model of concentric 1:1 layers with no regular relation between them other than the 7.2 Angstroms spacing, closely simulate the observed data. Evidence for the 2-layer structure that is generally accepted may need to be reassessed in the light of these results

  15. American Crystallographic Association Project: numerical ratings of powder diffraction patterns

    International Nuclear Information System (INIS)

    Smith, G.S.; Snyder, R.L.

    1977-01-01

    At present, nearly 30,000 powder diffraction patterns are available as references. It is proposed that the patterns in this file as well as new patterns submitted for publication be given quantitative quality factors. A simple-to-use figure of merit, F/sub N/, covering both accuracy of d-values and completeness of a pattern was derived. This figure of merit provides the user with a means of rapid evaluation of powder patterns in much the same way that the R-factor does for single-crystal structure determinations. The present F/sub N/ ranking scheme is shown to be superior to de Wolff's M 20 ranking scheme. It is recommended that the latter be discontinued. Guidelines are given on the use and implementation of F/sub N/ rating of powder diffraction patterns

  16. Relation between the diffraction pattern visibility and dispersion of particle sizes in an ektacytometer

    International Nuclear Information System (INIS)

    Nikitin, Sergei Yu; Lugovtsov, Andrei E; Priezzhev, A V; Ustinov, V D

    2011-01-01

    We have calculated the angular distribution of the light intensity in the diffraction pattern arising upon scattering of a laser beam on a suspension of red blood cells in an ektacytometer. We have estimated the diffraction pattern visibility in the region of the first diffraction minimum and the first diffraction maximum as a function of particle size variation. It is shown that in this fragment of the diffraction pattern its visibility decreases already twofold in the case of a standard deviation of the particle size from the average value, equal to 8%.

  17. The Effect of the Shape of Atomic Potential on the Diffraction Pattern ...

    African Journals Online (AJOL)

    We have simulated the diffraction patterns of both periodic and quasiperiodic monatomic chains using the code Laue (written by Silsbee and Drager) and investigated the effects of the shape of the atomic potential. Three fundamental differences between the diffraction patterns of periodic and quasiperiodic monatomic chain ...

  18. Diffraction-based overlay for spacer patterning and double patterning technology

    Science.gov (United States)

    Lee, Byoung Hoon; Park, JeongSu; Lee, Jongsu; Park, Sarohan; Lim, ChangMoon; Yim, Dong-Gyu; Park, Sungki; Ryu, Chan-Ho; Morgan, Stephen; van de Schaar, Maurits; Fuchs, Andreas; Bhattacharyya, Kaustuve

    2011-03-01

    Overlay performance will be increasingly important for Spacer Patterning Technology (SPT) and Double Patterning Technology (DPT) as various Resolution Enhancement Techniques are employed to extend the resolution limits of lithography. Continuous shrinkage of devices makes overlay accuracy one of the most critical issues while overlay performance is completely dependent on exposure tool. Image Based Overlay (IBO) has been used as the mainstream metrology for overlay by the main memory IC companies, but IBO is not suitable for some critical layers due to the poor Tool Induced Shift (TIS) values. Hence new overlay metrology is required to improve the overlay measurement accuracy. Diffraction Based Overlay (DBO) is regarded to be an alternative metrology to IBO for more accurate measurements and reduction of reading errors. Good overlay performances of DBO have been reported in many articles. However applying DBO for SPT and DPT layers poses extra challenges for target design. New vernier designs are considered for different DPT and SPT schemes to meet overlay target in DBO system. In this paper, we optimize the design of the DBO target and the performance of DBO to meet the overlay specification of sub-3x nm devices which are using SPT and DPT processes. We show that the appropriate vernier design yields excellent overlay performance in residual and TIS. The paper also demonstrated the effects of vernier structure on overlay accuracy from SEM analysis.

  19. Determination of the Projected Atomic Potential by Deconvolution of the Auto-Correlation Function of TEM Electron Nano-Diffraction Patterns

    Directory of Open Access Journals (Sweden)

    Liberato De Caro

    2016-11-01

    Full Text Available We present a novel method to determine the projected atomic potential of a specimen directly from transmission electron microscopy coherent electron nano-diffraction patterns, overcoming common limitations encountered so far due to the dynamical nature of electron-matter interaction. The projected potential is obtained by deconvolution of the inverse Fourier transform of experimental diffraction patterns rescaled in intensity by using theoretical values of the kinematical atomic scattering factors. This novelty enables the compensation of dynamical effects typical of transmission electron microscopy (TEM experiments on standard specimens with thicknesses up to a few tens of nm. The projected atomic potentials so obtained are averaged on sample regions illuminated by nano-sized electron probes and are in good quantitative agreement with theoretical expectations. Contrary to lens-based microscopy, here the spatial resolution in the retrieved projected atomic potential profiles is related to the finer lattice spacing measured in the electron diffraction pattern. The method has been successfully applied to experimental nano-diffraction data of crystalline centrosymmetric and non-centrosymmetric specimens achieving a resolution of 65 pm.

  20. Circular Hough transform diffraction analysis: A software tool for automated measurement of selected area electron diffraction patterns within Digital MicrographTM

    International Nuclear Information System (INIS)

    Mitchell, D.R.G.

    2008-01-01

    A software tool (script and plugin) for computing circular Hough transforms (CHT) in Digital Micrograph TM has been developed, for the purpose of automated analysis of selected area electron diffraction patterns (SADPs) of polycrystalline materials. The CHT enables the diffraction pattern centre to be determined with sub-pixel accuracy, regardless of the exposure condition of the transmitted beam or if a beam stop is present. Radii of the diffraction rings can also be accurately measured with sub-pixel precision. If the pattern is calibrated against a known camera length, then d-spacings with an accuracy of better than 1% can be obtained. These measurements require no a priori knowledge of the pattern and very limited user interaction. The accuracy of the CHT is degraded by distortion introduced by the projector lens, and this should be minimised prior to pattern acquisition. A number of optimisations in the CHT software enable rapid processing of patterns; a typical analysis of a 1kx1k image taking just a few minutes. The CHT tool appears robust and is even able to accurately measure SADPs with very incomplete diffraction rings due to texture effects. This software tool is freely downloadable via the Internet

  1. Vector wave diffraction pattern of slits masked by polarizing devices

    Indian Academy of Sciences (India)

    This calls for a systematic study of diffraction properties of different apertures using polarization-sensitive devices. In the present paper, we have studied the Fraunhofer diffraction pattern of slits masked by different kinds of polarizing devices which introduce a phase difference between the two orthogonal components of the ...

  2. Immobilization of biomolecules onto surfaces according to ultraviolet light diffraction patterns

    International Nuclear Information System (INIS)

    Bjoern Petersen, Steffen; Kold di Gennaro, Ane; Neves-Petersen, Maria Teresa; Skovsen, Esben; Parracino, Antonietta

    2010-01-01

    We developed a method for immobilization of biomolecules onto thiol functionalized surfaces according to UV diffraction patterns. UV light-assisted molecular immobilization proceeds through the formation of free, reactive thiol groups that can bind covalently to thiol reactive surfaces. We demonstrate that, by shaping the pattern of the UV light used to induce molecular immobilization, one can control the pattern of immobilized molecules onto the surface. Using a single-aperture spatial mask, combined with the Fourier transforming property of a focusing lens, we show that submicrometer (0.7 μm) resolved patterns of immobilized prostate-specific antigen biomolecules can be created. If a dual-aperture spatial mask is used, the results differ from the expected Fourier transform pattern of the mask. It appears as a superposition of two diffraction patterns produced by the two apertures, with a fine structured interference pattern superimposed.

  3. Diffraction-based overlay metrology for double patterning technologies

    Science.gov (United States)

    Dasari, Prasad; Korlahalli, Rahul; Li, Jie; Smith, Nigel; Kritsun, Oleg; Volkman, Cathy

    2009-03-01

    The extension of optical lithography to 32nm and beyond is made possible by Double Patterning Techniques (DPT) at critical levels of the process flow. The ease of DPT implementation is hindered by increased significance of critical dimension uniformity and overlay errors. Diffraction-based overlay (DBO) has shown to be an effective metrology solution for accurate determination of the overlay errors associated with double patterning [1, 2] processes. In this paper we will report its use in litho-freeze-litho-etch (LFLE) and spacer double patterning technology (SDPT), which are pitch splitting solutions that reduce the significance of overlay errors. Since the control of overlay between various mask/level combinations is critical for fabrication, precise and accurate assessment of errors by advanced metrology techniques such as spectroscopic diffraction based overlay (DBO) and traditional image-based overlay (IBO) using advanced target designs will be reported. A comparison between DBO, IBO and CD-SEM measurements will be reported. . A discussion of TMU requirements for 32nm technology and TMU performance data of LFLE and SDPT targets by different overlay approaches will be presented.

  4. Size effect in X-ray and electron diffraction patterns from hydroxyapatite particles

    International Nuclear Information System (INIS)

    Suvorova, E.I.; Buffat, P.-A.

    2001-01-01

    High-resolution transmission electron microscopy (HRTEM), electron microdiffraction, and X-ray diffraction were used to study hydroxyapatite specimens with particle sizes from a few nanometers to several hundreds of nanometers. Diffuse scattering (without clear reflections in transmission diffraction patterns) or strongly broadened peaks in X-ray diffraction patterns are characteristic for agglomerated hydroxyapatite nanocrystals. However, HRTEM and microdiffraction showed that this cannot be considered as an indication of the amorphous state of the matter but rather as the demonstration of size effect and the morphological and structural features of hydroxyapatite nanocrystals

  5. Multifocus microscopy with precise color multi-phase diffractive optics applied in functional neuronal imaging.

    Science.gov (United States)

    Abrahamsson, Sara; Ilic, Rob; Wisniewski, Jan; Mehl, Brian; Yu, Liya; Chen, Lei; Davanco, Marcelo; Oudjedi, Laura; Fiche, Jean-Bernard; Hajj, Bassam; Jin, Xin; Pulupa, Joan; Cho, Christine; Mir, Mustafa; El Beheiry, Mohamed; Darzacq, Xavier; Nollmann, Marcelo; Dahan, Maxime; Wu, Carl; Lionnet, Timothée; Liddle, J Alexander; Bargmann, Cornelia I

    2016-03-01

    Multifocus microscopy (MFM) allows high-resolution instantaneous three-dimensional (3D) imaging and has been applied to study biological specimens ranging from single molecules inside cells nuclei to entire embryos. We here describe pattern designs and nanofabrication methods for diffractive optics that optimize the light-efficiency of the central optical component of MFM: the diffractive multifocus grating (MFG). We also implement a "precise color" MFM layout with MFGs tailored to individual fluorophores in separate optical arms. The reported advancements enable faster and brighter volumetric time-lapse imaging of biological samples. In live microscopy applications, photon budget is a critical parameter and light-efficiency must be optimized to obtain the fastest possible frame rate while minimizing photodamage. We provide comprehensive descriptions and code for designing diffractive optical devices, and a detailed methods description for nanofabrication of devices. Theoretical efficiencies of reported designs is ≈90% and we have obtained efficiencies of > 80% in MFGs of our own manufacture. We demonstrate the performance of a multi-phase MFG in 3D functional neuronal imaging in living C. elegans.

  6. Inversion of convergent-beam electron diffraction patterns

    International Nuclear Information System (INIS)

    Bird, D.M.; Saunders, M.

    1992-01-01

    The problem of recovering the structure factors that contribute to a zone-axis convergent-beam diffraction pattern is discussed. It is shown that an automated matching procedure that minimizes the sum-of-squares difference between experimental and simulated patterns is effective whether one is refining accurate structure factors in a known crystal or attempting ab initio structure determination. The details of the minimization method are analysed and it is shown that a quasi-Newton method that uses analytically derived gradients is particulary effective when several structure factors are varied. The inversion method for ab initio structure determination is tested on the [110] axis of GaP, using simulated patterns as ideal 'experimental' data. (orig.)

  7. Time-resolved measurements with streaked diffraction patterns from electrons generated in laser plasma wakefield

    Science.gov (United States)

    He, Zhaohan; Nees, John; Hou, Bixue; Krushelnick, Karl; Thomas, Alec; Beaurepaire, Benoît; Malka, Victor; Faure, Jérôme

    2013-10-01

    Femtosecond bunches of electrons with relativistic to ultra-relativistic energies can be robustly produced in laser plasma wakefield accelerators (LWFA). Scaling the electron energy down to sub-relativistic and MeV level using a millijoule laser system will make such electron source a promising candidate for ultrafast electron diffraction (UED) applications due to the intrinsic short bunch duration and perfect synchronization with the optical pump. Recent results of electron diffraction from a single crystal gold foil, using LWFA electrons driven by 8-mJ, 35-fs laser pulses at 500 Hz, will be presented. The accelerated electrons were collimated with a solenoid magnetic lens. By applying a small-angle tilt to the magnetic lens, the diffraction pattern can be streaked such that the temporal evolution is separated spatially on the detector screen after propagation. The observable time window and achievable temporal resolution are studied in pump-probe measurements of photo-induced heating on the gold foil.

  8. Dark-field imaging based on post-processed electron backscatter diffraction patterns of bulk crystalline materials in a scanning electron microscope.

    Science.gov (United States)

    Brodusch, Nicolas; Demers, Hendrix; Gauvin, Raynald

    2015-01-01

    Dark-field (DF) images were acquired in the scanning electron microscope with an offline procedure based on electron backscatter diffraction (EBSD) patterns (EBSPs). These EBSD-DF images were generated by selecting a particular reflection on the electron backscatter diffraction pattern and by reporting the intensity of one or several pixels around this point at each pixel of the EBSD-DF image. Unlike previous studies, the diffraction information of the sample is the basis of the final image contrast with a pixel scale resolution at the EBSP providing DF imaging in the scanning electron microscope. The offline facility of this technique permits the selection of any diffraction condition available in the diffraction pattern and displaying the corresponding image. The high number of diffraction-based images available allows a better monitoring of deformation structures compared to electron channeling contrast imaging (ECCI) which is generally limited to a few images of the same area. This technique was applied to steel and iron specimens and showed its high capability in describing more rigorously the deformation structures around micro-hardness indents. Due to the offline relation between the reference EBSP and the EBSD-DF images, this new technique will undoubtedly greatly improve our knowledge of deformation mechanism and help to improve our understanding of the ECCI contrast mechanisms. Copyright © 2014 Elsevier B.V. All rights reserved.

  9. Circular Hough transform diffraction analysis: A software tool for automated measurement of selected area electron diffraction patterns within Digital Micrograph{sup TM}

    Energy Technology Data Exchange (ETDEWEB)

    Mitchell, D.R.G. [Institute of Materials and Engineering Science, ANSTO, PMB 1, Menai, NSW 2234 (Australia)], E-mail: drm@ansto.gov.au

    2008-03-15

    A software tool (script and plugin) for computing circular Hough transforms (CHT) in Digital Micrograph{sup TM} has been developed, for the purpose of automated analysis of selected area electron diffraction patterns (SADPs) of polycrystalline materials. The CHT enables the diffraction pattern centre to be determined with sub-pixel accuracy, regardless of the exposure condition of the transmitted beam or if a beam stop is present. Radii of the diffraction rings can also be accurately measured with sub-pixel precision. If the pattern is calibrated against a known camera length, then d-spacings with an accuracy of better than 1% can be obtained. These measurements require no a priori knowledge of the pattern and very limited user interaction. The accuracy of the CHT is degraded by distortion introduced by the projector lens, and this should be minimised prior to pattern acquisition. A number of optimisations in the CHT software enable rapid processing of patterns; a typical analysis of a 1kx1k image taking just a few minutes. The CHT tool appears robust and is even able to accurately measure SADPs with very incomplete diffraction rings due to texture effects. This software tool is freely downloadable via the Internet.

  10. Diffraction contrast imaging using virtual apertures

    International Nuclear Information System (INIS)

    Gammer, Christoph; Burak Ozdol, V.; Liebscher, Christian H.; Minor, Andrew M.

    2015-01-01

    Two methods on how to obtain the full diffraction information from a sample region and the associated reconstruction of images or diffraction patterns using virtual apertures are demonstrated. In a STEM-based approach, diffraction patterns are recorded for each beam position using a small probe convergence angle. Similarly, a tilt series of TEM dark-field images is acquired. The resulting datasets allow the reconstruction of either electron diffraction patterns, or bright-, dark- or annular dark-field images using virtual apertures. The experimental procedures of both methods are presented in the paper and are applied to a precipitation strengthened and creep deformed ferritic alloy with a complex microstructure. The reconstructed virtual images are compared with conventional TEM images. The major advantage is that arbitrarily shaped virtual apertures generated with image processing software can be designed without facing any physical limitations. In addition, any virtual detector that is specifically designed according to the underlying crystal structure can be created to optimize image contrast. - Highlights: • A dataset containing all structural information of a given position is recorded. • The dataset allows reconstruction of virtual diffraction patterns or images. • Specific virtual apertures are designed to image precipitates in a complex alloy. • Virtual diffraction patterns from arbitrarily small regions can be established. • Using STEM diffraction to record the dataset is more efficient than TEM dark-field

  11. Electron diffraction patterns with thermal diffuse scattering maxima around Kikuchi lines

    International Nuclear Information System (INIS)

    Karakhanyan, R. K.; Karakhanyan, K. R.

    2011-01-01

    Transmission electron diffraction patterns of silicon with thermal diffuse maxima around Kikuchi lines, which are analogs of the maxima of thermal diffuse electron scattering around point reflections, have been recorded. Diffuse maxima are observed only around Kikuchi lines with indices that are forbidden for the silicon structure. The diffraction conditions for forming these maxima are discussed.

  12. Diffractive and coloured films by laser interferometry patterning

    Czech Academy of Sciences Publication Activity Database

    Peláez, R.J.; Afonso, C.N.; Bulíř, Jiří; Lančok, Ján; Novotný, Michal

    2012-01-01

    Roč. 211, Oct (2012), s. 205-208 ISSN 0257-8972 R&D Projects: GA AV ČR IAA100100718; GA ČR GP202/09/P324 Institutional research plan: CEZ:AV0Z10100522 Keywords : laser-patterning * metal * films * nanoparticles * diffraction * colour Subject RIV: BM - Solid Matter Physics ; Magnetism Impact factor: 1.941, year: 2012

  13. Coherent Rabi oscillations in a molecular system and sub-diffraction-limited pattern generation

    International Nuclear Information System (INIS)

    Liao, Zeyang; Al-Amri, M; Zubairy, M Suhail

    2015-01-01

    The resolution of a photolithography and optical imaging system is restricted by the diffraction limit. Coherent Rabi oscillations have been shown to be able to overcome the diffraction limit in a simple two-level atomic system (Z Liao, M Al-amri, and M S Zubairy 2010 Phys. Rev. Lett. 105 183601). In this paper, we numerically calculate the wave packet dynamics of a molecular system interacting with an ultrashort laser pulse and show that coherent Rabi oscillations in a molecular system are also possible. Moreover, a sub-diffraction-limited pattern can be generated in this system by introducing spatially modulated Rabi oscillations. We also discuss several techniques to improve the visibility of the sub-diffraction-limited pattern. Our result may have important applications in super-resolution optical lithography and optical imaging. (paper)

  14. Indexing amyloid peptide diffraction from serial femtosecond crystallography: new algorithms for sparse patterns

    Energy Technology Data Exchange (ETDEWEB)

    Brewster, Aaron S. [Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States); Sawaya, Michael R. [University of California, Los Angeles, CA 90095-1570 (United States); University of California, Los Angeles, CA 90095-1570 (United States); University of California, Los Angeles, CA 90095-1570 (United States); Rodriguez, Jose [University of California, Los Angeles, CA 90095-1570 (United States); University of California, Los Angeles, CA 90095-1570 (United States); Hattne, Johan; Echols, Nathaniel [Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States); McFarlane, Heather T. [University of California, Los Angeles, CA 90095-1570 (United States); University of California, Los Angeles, CA 90095-1570 (United States); Cascio, Duilio [University of California, Los Angeles, CA 90095-1570 (United States); University of California, Los Angeles, CA 90095-1570 (United States); University of California, Los Angeles, CA 90095-1570 (United States); Adams, Paul D. [Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States); University of California, Berkeley, CA 94720 (United States); Eisenberg, David S. [University of California, Los Angeles, CA 90095-1570 (United States); University of California, Los Angeles, CA 90095-1570 (United States); University of California, Los Angeles, CA 90095-1570 (United States); Sauter, Nicholas K., E-mail: nksauter@lbl.gov [Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States)

    2015-02-01

    Special methods are required to interpret sparse diffraction patterns collected from peptide crystals at X-ray free-electron lasers. Bragg spots can be indexed from composite-image powder rings, with crystal orientations then deduced from a very limited number of spot positions. Still diffraction patterns from peptide nanocrystals with small unit cells are challenging to index using conventional methods owing to the limited number of spots and the lack of crystal orientation information for individual images. New indexing algorithms have been developed as part of the Computational Crystallography Toolbox (cctbx) to overcome these challenges. Accurate unit-cell information derived from an aggregate data set from thousands of diffraction patterns can be used to determine a crystal orientation matrix for individual images with as few as five reflections. These algorithms are potentially applicable not only to amyloid peptides but also to any set of diffraction patterns with sparse properties, such as low-resolution virus structures or high-throughput screening of still images captured by raster-scanning at synchrotron sources. As a proof of concept for this technique, successful integration of X-ray free-electron laser (XFEL) data to 2.5 Å resolution for the amyloid segment GNNQQNY from the Sup35 yeast prion is presented.

  15. Immobilization of biomolecules onto surfaces according to ultraviolet light diffraction patterns

    DEFF Research Database (Denmark)

    Petersen, Steffen B.; Gennaro, Ane Kold Di; Neves Petersen, Teresa

    2010-01-01

    We developed a method for immobilization of biomolecules onto thiol functionalized surfaces according to UV diffraction patterns. UV light-assisted molecular immobilization proceeds through the formation of free, reactive thiol groups that can bind covalently to thiol reactive surfaces. We demons......, with a fine structured interference pattern superimposed. (C) 2010 Optical Society of America...

  16. X-ray diffraction patterns and diffracted intensity of Kα spectral lines of He-like ions

    Science.gov (United States)

    Goyal, Arun; Khatri, Indu; Singh, A. K.; Sharma, Rinku; Mohan, Man

    2017-09-01

    In the present paper, we have calculated fine-structure energy levels related to the configurations 1s2s, 1s2p, 1s3s and 1s3p by employing GRASP2K code. We have also computed radiative data for transitions from 1s2p 1 P1o, 1s2p 3 P2o, 1s2p 3 P1o and 1s2s 3S1 to the ground state 1s2. We have made comparisons of our presented energy levels and transition wavelengths with available results compiled by NIST and good agreement is achieved. We have also provided X-ray diffraction (XRD) patterns of Kα spectral lines, namely w, x, y and z of Cu XXVIII, Kr XXXV and Mo with diffraction angle and maximum diffracted intensity which is not published elsewhere in the literature. We believe that our presented results may be beneficial in determination of the order parameter, X-ray crystallography, solid-state drug analysis, forensic science, geological and medical applications.

  17. Simulation of the diffraction pattern of one dimensional quasicrystal ...

    African Journals Online (AJOL)

    The effects of the variation of atomic spacing ratio of a one dimensional quasicrystal material are investigated. The work involves the use of the solid state simulation code, Laue written by Silsbee and Drager. We are able to observe the general features of the diffraction pattern by a quasicrystal. In addition, it has been found ...

  18. High-speed classification of coherent X-ray diffraction patterns on the K computer for high-resolution single biomolecule imaging

    Energy Technology Data Exchange (ETDEWEB)

    Tokuhisa, Atsushi [RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5148 (Japan); Arai, Junya [The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033 (Japan); Joti, Yasumasa [JASRI, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198 (Japan); Ohno, Yoshiyuki; Kameyama, Toyohisa; Yamamoto, Keiji; Hatanaka, Masayuki; Gerofi, Balazs; Shimada, Akio; Kurokawa, Motoyoshi; Shoji, Fumiyoshi [RIKEN Advanced Institute for Computational Science, 7-1-26 Minatojima-minami-machi, Chuo-ku, Kobe, Hyogo 650-0047 (Japan); Okada, Kensuke [RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5148 (Japan); Sugimoto, Takashi [JASRI, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198 (Japan); Yamaga, Mitsuhiro; Tanaka, Ryotaro [RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5148 (Japan); Yokokawa, Mitsuo; Hori, Atsushi [RIKEN Advanced Institute for Computational Science, 7-1-26 Minatojima-minami-machi, Chuo-ku, Kobe, Hyogo 650-0047 (Japan); Ishikawa, Yutaka, E-mail: ishikawa@is.s.u-tokyo.ac.jp [The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033 (Japan); Hatsui, Takaki, E-mail: ishikawa@is.s.u-tokyo.ac.jp [RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5148 (Japan); Go, Nobuhiro [Japan Atomic Energy Agency, 8-1-7 Umemidai, Kizugawa, Kyoto 619-0215 (Japan)

    2013-11-01

    A code with an algorithm for high-speed classification of X-ray diffraction patterns has been developed. Results obtained for a set of 1 × 10{sup 6} simulated diffraction patterns are also reported. Single-particle coherent X-ray diffraction imaging using an X-ray free-electron laser has the potential to reveal the three-dimensional structure of a biological supra-molecule at sub-nanometer resolution. In order to realise this method, it is necessary to analyze as many as 1 × 10{sup 6} noisy X-ray diffraction patterns, each for an unknown random target orientation. To cope with the severe quantum noise, patterns need to be classified according to their similarities and average similar patterns to improve the signal-to-noise ratio. A high-speed scalable scheme has been developed to carry out classification on the K computer, a 10PFLOPS supercomputer at RIKEN Advanced Institute for Computational Science. It is designed to work on the real-time basis with the experimental diffraction pattern collection at the X-ray free-electron laser facility SACLA so that the result of classification can be feedback for optimizing experimental parameters during the experiment. The present status of our effort developing the system and also a result of application to a set of simulated diffraction patterns is reported. About 1 × 10{sup 6} diffraction patterns were successfully classificatied by running 255 separate 1 h jobs in 385-node mode.

  19. Koch fractals in physical optics and their Fraunhofer diffraction patterns

    Czech Academy of Sciences Publication Activity Database

    Horváth, P.; Šmíd, Petr; Vašková, I.; Hrabovský, M.

    2010-01-01

    Roč. 121, č. 2 (2010), s. 206-2134 ISSN 0030-4026 R&D Projects: GA MŠk(CZ) 1M06002 Institutional research plan: CEZ:AV0Z10100522 Keywords : Koch fractal s * Fraunhofer diffraction patterns Subject RIV: BH - Optics, Masers, Lasers Impact factor: 0.454, year: 2010

  20. Borehole radar diffraction tomography

    Energy Technology Data Exchange (ETDEWEB)

    Cho, Seong Jun; Kim, Jung Ho; Yi, Myeong Jong; Chung, Seung Hwan; Lee, Hee Il [Korea Institute of Geology Mining and Materials, Taejon (Korea, Republic of)

    1997-12-01

    Tomography is widely used as imaging method for determining subsurface structure. Among the reconstruction algorithms for tomographic imaging, travel time tomography is almost applied to imaging subsurface. But isolated small body comparable with the wavelength could not be well recognized by travel time tomography. Other tomographic method are need to improve the imaging process. In the study of this year, diffraction tomography was investigated. The theory for diffraction tomography is based on the 1st-order Born approximation. Multisource holography, which is similar to Kirchihoff migration, is compared with diffraction tomography. To improve 1st-order Born diffraction tomography, two kinds of filter designed from multisource holography and 2-D green function, respectively, applied on the reconstructed image. The algorithm was tested for the numerical modeling data of which algorithm consists of the analytic computation of radar signal in transmitter and receiver regions and 2-D FDM scheme for the propagation of electromagnetic waves in media. The air-filled cavity model to show a typical diffraction pattern was applied to diffraction tomography imaging, and the result shows accurate location and area of cavity. But the calculated object function is not well matched the real object function, because the air-filled cavity model is not satisfied week scattered inhomogeneity for 1st born approximation, and the error term is included in estimating source wavelet from received signals. In spite of the object function error, the diffraction tomography assist for interpretation of subsurface as if conducted with travel time tomography. And the fracture model was tested, 1st born diffraction tomographic image is poor because of limited view angle coverage and violation of week scatter assumption, but the filtered image resolve the fracture somewhat better. The tested diffraction tomography image confirms effectiveness of filter for enhancing resolution. (author). 14

  1. X-ray diffraction patterns of metal aurocyanides

    International Nuclear Information System (INIS)

    Selig, W.S.; Smith, G.S.; Harding, K.K.; Summers, L.J.

    1989-06-01

    Aurocyanides of the following metal cations have been prepared: Ag, Hg(II), Ga, Fe(III), Tl(I), Bi, Pb, Mn(II), Ni, Zn, Cu(II), Cd, In, and Co(II). Most of the aurocyanides are of the type M[Au(CN) 2 ] x where M is the metal cation and x its valence. However, under some conditions mixed aurocyanides containing K may be formed, such as KCo[Au(CN) 2 ] 3 . Only Ag and Hg(II) form aurocyanides which are sufficiently insoluble for the potentiometric determination of the aurocyanide anion. The diffraction patterns of the various aurocyanides are reported. 12 refs., 16 tabs

  2. Natural quasy-periodic binary structure with focusing property in near field diffraction pattern.

    Science.gov (United States)

    Mihailescu, Mona

    2010-06-07

    A naturally-inspired phase-only diffractive optical element with a circular symmetry given by a quasi-periodic structure of the phyllotaxis type is presented in this paper. It is generated starting with the characteristic parametric equations which are optimal for the golden angle interval. For some ideal geometrical parameters, the diffracted intensity distribution in near-field has a central closed ring with almost zero intensity inside. Its radius and intensity values depend on the geometry or non-binary phase distribution superposed onto the phyllotaxis geometry. Along propagation axis, the transverse diffraction patterns from the binary-phase diffractive structure exhibit a self-focusing behavior and a rotational motion.

  3. Characterization of breast tissue using energy-dispersive X-ray diffraction computed tomography

    International Nuclear Information System (INIS)

    Pani, S.; Cook, E.J.; Horrocks, J.A.; Jones, J.L.; Speller, R.D.

    2010-01-01

    A method for sample characterization using energy-dispersive X-ray diffraction computed tomography (EDXRDCT) is presented. The procedures for extracting diffraction patterns from the data and the corrections applied are discussed. The procedures were applied to the characterization of breast tissue samples, 6 mm in diameter. Comparison with histological sections of the samples confirmed the possibility of grouping the patterns into five families, corresponding to adipose tissue, fibrosis, poorly differentiated cancer, well differentiated cancer and benign tumour.

  4. Coherent diffraction microscopy at SPring-8: instrumentation, data acquisition and data analysis

    International Nuclear Information System (INIS)

    Xu, Rui; Salha, Sara; Raines, Kevin S.; Jiang, Huaidong; Chen, Chien-Chun; Takahashi, Yukio; Kohmura, Yoshiki; Nishino, Yoshinori; Song, Changyong; Ishikawa, Tetsuya; Miao, Jianwei

    2011-01-01

    An instrumentation and data analysis review of coherent diffraction microscopy at SPring-8 is given. This work will be of interest to those who want to apply coherent diffraction imaging to studies of materials science and biological samples. Since the first demonstration of coherent diffraction microscopy in 1999, this lensless imaging technique has been experimentally refined by continued developments. Here, instrumentation and experimental procedures for measuring oversampled diffraction patterns from non-crystalline specimens using an undulator beamline (BL29XUL) at SPring-8 are presented. In addition, detailed post-experimental data analysis is provided that yields high-quality image reconstructions. As the acquisition of high-quality diffraction patterns is at least as important as the phase-retrieval procedure to guarantee successful image reconstructions, this work will be of interest for those who want to apply this imaging technique to materials science and biological samples

  5. Multiwavelength Absolute Phase Retrieval from Noisy Diffractive Patterns: Wavelength Multiplexing Algorithm

    Directory of Open Access Journals (Sweden)

    Vladimir Katkovnik

    2018-05-01

    Full Text Available We study the problem of multiwavelength absolute phase retrieval from noisy diffraction patterns. The system is lensless with multiwavelength coherent input light beams and random phase masks applied for wavefront modulation. The light beams are formed by light sources radiating all wavelengths simultaneously. A sensor equipped by a Color Filter Array (CFA is used for spectral measurement registration. The developed algorithm targeted on optimal phase retrieval from noisy observations is based on maximum likelihood technique. The algorithm is specified for Poissonian and Gaussian noise distributions. One of the key elements of the algorithm is an original sparse modeling of the multiwavelength complex-valued wavefronts based on the complex-domain block-matching 3D filtering. Presented numerical experiments are restricted to noisy Poissonian observations. They demonstrate that the developed algorithm leads to effective solutions explicitly using the sparsity for noise suppression and enabling accurate reconstruction of absolute phase of high-dynamic range.

  6. X-ray diffraction patterns in high-energy proton implanted silicon

    International Nuclear Information System (INIS)

    Wieteska, K.; Dluzewska, K.D.; Wierzchowski, W.; Graeff, W.

    1998-01-01

    Silicon crystals implanted with 1 and 1.6 MeV protons were studied by means of conventional source double-crystal and synchrotron multi-crystal arrangements. Both the rocking curves and series of topographs were recorded in different parallel settings employing different reflections and wavelengths of radiation. A comparison of rocking curves in different regions of implanted areas was performed in synchrotron multi-crystal arrangement with a beam of a very small diameter. The rocking curves exhibited subsidiary interference maxima with increasing periodicity on the low angle side. The plane wave topographs taken at different angular setting revealed characteristic fringes whose number decreased with increasing distance from the main maximum. The fringe pattern did not depend on the direction of the diffraction vector. The number of fringes for equivalent angular distance from the maximum was larger for higher order of reflection. The shape of the rocking curve and other diffraction patterns were reasonably explained assuming the lattice parameter change depth distribution proportional to the profile obtained from the Biersack-Ziegler theory and lateral non-uniformity of ion dose. A good approximation of the experimental results was obtained using numerical integration of the Takagi-Taupin equations. (orig.)

  7. High quality single shot diffraction patterns using ultrashort megaelectron volt electron beams from a radio frequency photoinjector

    Energy Technology Data Exchange (ETDEWEB)

    Musumeci, P.; Moody, J. T.; Scoby, C. M.; Gutierrez, M. S. [Department of Physics and Astronomy, UCLA, Los Angeles, California 90095 (United States); Bender, H. A.; Wilcox, N. S. [National Security Technologies, LLC, Los Alamos Operations, Los Alamos, New Mexico 87544 (United States)

    2010-01-15

    Single shot diffraction patterns using a 250-fs-long electron beam have been obtained at the UCLA Pegasus laboratory. High quality images with spatial resolution sufficient to distinguish closely spaced peaks in the Debye-Scherrer ring pattern have been recorded by scattering the 1.6 pC 3.5 MeV electron beam generated in the rf photoinjector off a 100-nm-thick Au foil. Dark current and high emittance particles are removed from the beam before sending it onto the diffraction target using a 1 mm diameter collimating hole. These results open the door to the study of irreversible phase transformations by single shot MeV electron diffraction.

  8. High quality single shot diffraction patterns using ultrashort megaelectron volt electron beams from a radio frequency photoinjector.

    Science.gov (United States)

    Musumeci, P; Moody, J T; Scoby, C M; Gutierrez, M S; Bender, H A; Wilcox, N S

    2010-01-01

    Single shot diffraction patterns using a 250-fs-long electron beam have been obtained at the UCLA Pegasus laboratory. High quality images with spatial resolution sufficient to distinguish closely spaced peaks in the Debye-Scherrer ring pattern have been recorded by scattering the 1.6 pC 3.5 MeV electron beam generated in the rf photoinjector off a 100-nm-thick Au foil. Dark current and high emittance particles are removed from the beam before sending it onto the diffraction target using a 1 mm diameter collimating hole. These results open the door to the study of irreversible phase transformations by single shot MeV electron diffraction.

  9. High quality single shot diffraction patterns using ultrashort megaelectron volt electron beams from a radio frequency photoinjector

    International Nuclear Information System (INIS)

    Musumeci, P.; Moody, J. T.; Scoby, C. M.; Gutierrez, M. S.; Bender, H. A.; Wilcox, N. S.

    2010-01-01

    Single shot diffraction patterns using a 250-fs-long electron beam have been obtained at the UCLA Pegasus laboratory. High quality images with spatial resolution sufficient to distinguish closely spaced peaks in the Debye-Scherrer ring pattern have been recorded by scattering the 1.6 pC 3.5 MeV electron beam generated in the rf photoinjector off a 100-nm-thick Au foil. Dark current and high emittance particles are removed from the beam before sending it onto the diffraction target using a 1 mm diameter collimating hole. These results open the door to the study of irreversible phase transformations by single shot MeV electron diffraction.

  10. Improved orientation sampling for indexing diffraction patterns of polycrystalline materials

    DEFF Research Database (Denmark)

    Larsen, Peter Mahler; Schmidt, Søren

    2017-01-01

    to that of optimally distributing points on a four‐dimensional sphere. In doing so, the number of orientation samples needed to achieve a desired indexing accuracy is significantly reduced. Orientation sets at a range of sizes are generated in this way for all Laue groups and are made available online for easy use.......Orientation mapping is a widely used technique for revealing the microstructure of a polycrystalline sample. The crystalline orientation at each point in the sample is determined by analysis of the diffraction pattern, a process known as pattern indexing. A recent development in pattern indexing...... in the presence of noise, it has very high computational requirements. In this article, the computational burden is reduced by developing a method for nearly optimal sampling of orientations. By using the quaternion representation of orientations, it is shown that the optimal sampling problem is equivalent...

  11. High resolution electron exit wave reconstruction from a diffraction pattern using Gaussian basis decomposition

    International Nuclear Information System (INIS)

    Borisenko, Konstantin B; Kirkland, Angus I

    2014-01-01

    We describe an algorithm to reconstruct the electron exit wave of a weak-phase object from single diffraction pattern. The algorithm uses analytic formulations describing the diffraction intensities through a representation of the object exit wave in a Gaussian basis. The reconstruction is achieved by solving an overdetermined system of non-linear equations using an easily parallelisable global multi-start search with Levenberg-Marquard optimisation and analytic derivatives

  12. Direct integration of the S-matrix applied to rigorous diffraction

    International Nuclear Information System (INIS)

    Iff, W; Lindlein, N; Tishchenko, A V

    2014-01-01

    A novel Fourier method for rigorous diffraction computation at periodic structures is presented. The procedure is based on a differential equation for the S-matrix, which allows direct integration of the S-matrix blocks. This results in a new method in Fourier space, which can be considered as a numerically stable and well-parallelizable alternative to the conventional differential method based on T-matrix integration and subsequent conversions from the T-matrices to S-matrix blocks. Integration of the novel differential equation in implicit manner is expounded. The applicability of the new method is shown on the basis of 1D periodic structures. It is clear however, that the new technique can also be applied to arbitrary 2D periodic or periodized structures. The complexity of the new method is O(N 3 ) similar to the conventional differential method with N being the number of diffraction orders. (fast track communication)

  13. Diffraction efficiency enhancement of femtosecond laser-engraved diffraction gratings due to CO2 laser polishing

    International Nuclear Information System (INIS)

    Choi, Hun-Kook; Jung, Deok; Sohn, Ik-Bu; Noh, Young-Chul; Lee, Yong-Tak; Kim, Jin-Tae; Ahsan, Shamim

    2014-01-01

    This research demonstrates laser-assisted fabrication of high-efficiency diffraction gratings in fused-silica glass samples. Initially, femtosecond laser pulses are used to engrave diffraction gratings on the glass surfaces. Then, these micro-patterned glass samples undergo CO 2 laser polishing process. unpolished diffraction gratings encoded in the glass samples show an overall diffraction efficiency of 18.1%. diffraction gratings imprinted on the glass samples and then polished four times by using a CO 2 laser beam attain a diffraction efficiency of 32.7%. We also investigate the diffraction patterns of the diffraction gratings encoded on fused-silica glass surfaces. The proposed CO 2 laser polishing technique shows great potential in patterning high-efficiency diffraction gratings on the surfaces of various transparent materials.

  14. ZDS - a computer program for analysis of X-ray powder diffraction patterns

    International Nuclear Information System (INIS)

    Ondrus, P.

    1993-01-01

    The ZDS system creates an integrated environment of procedures for complete and precise analysis of raw powder diffraction patterns. The basis of the ZDS system is a graphic control centre for easy and user-friendly application of all included procedures. It offers a number of application procedures without an interaction with any data base. The program operates either in an automatic or manual mode. The manual mode makes possible specialized applications. The input and output of the data are compatible with Philips and Siemens powder diffraction software. The ZDS system runs with Intel 80286 or 80386-based PC computers with or without math-coprocesor. (orig.)

  15. Quantitative analysis of calcined fertilizers by X-ray diffraction patterns

    International Nuclear Information System (INIS)

    Cekinski, E.

    1987-01-01

    An X-ray diffraction pattern method for quantitative analyses of phosphate fertilizers obtained by calcination of a misture of Anitapolis phosphate concentrate and sodium carbonate is described. The method consists in plotting a calibration curve, using spinel (MgAl 2 O 4 ) as internal standard, of the phases that were formed by calcination, sintetized in laboratory. The tests conducted in order to avail the method accuracy showed good correlation between the obtained data and the real values. (author) [pt

  16. Diffraction efficiency enhancement of femtosecond laser-engraved diffraction gratings due to CO{sub 2} laser polishing

    Energy Technology Data Exchange (ETDEWEB)

    Choi, Hun-Kook [Gwangju Institute of Science and Technology, Gwangju (Korea, Republic of); Chosun University, Gwangju (Korea, Republic of); Jung, Deok; Sohn, Ik-Bu; Noh, Young-Chul; Lee, Yong-Tak [Gwangju Institute of Science and Technology, Gwangju (Korea, Republic of); Kim, Jin-Tae [Chosun University, Gwangju (Korea, Republic of); Ahsan, Shamim [Khulna University, Khulna (Bangladesh)

    2014-11-15

    This research demonstrates laser-assisted fabrication of high-efficiency diffraction gratings in fused-silica glass samples. Initially, femtosecond laser pulses are used to engrave diffraction gratings on the glass surfaces. Then, these micro-patterned glass samples undergo CO{sub 2} laser polishing process. unpolished diffraction gratings encoded in the glass samples show an overall diffraction efficiency of 18.1%. diffraction gratings imprinted on the glass samples and then polished four times by using a CO{sub 2} laser beam attain a diffraction efficiency of 32.7%. We also investigate the diffraction patterns of the diffraction gratings encoded on fused-silica glass surfaces. The proposed CO{sub 2} laser polishing technique shows great potential in patterning high-efficiency diffraction gratings on the surfaces of various transparent materials.

  17. Stress evaluation in thin films: Micro-focus synchrotron X-ray diffraction combined with focused ion beam patterning for d{sub o} evaluation

    Energy Technology Data Exchange (ETDEWEB)

    Baimpas, Nikolaos, E-mail: nikolaos.baimpas@eng.ox.ac.uk [University of Oxford, Dept. of Engineering Science (United Kingdom); Le Bourhis, Eric [University of Poitiers, Institut P' , Laboratoire de Physique des Matériaux, Poitiers (France); Eve, Sophie [ENSICAEN, CRISMAT, Caen (France); Thiaudière, Dominique [Synchrotron SOLEIL, L' Orme des Merisiers Saint-Aubin, Paris (France); Hardie, Christopher [University of Oxford, Materials Department (United Kingdom); Korsunsky, Alexander M. [University of Oxford, Dept. of Engineering Science (United Kingdom)

    2013-12-31

    Nanocrystalline metallic coatings of sub-micron thickness are widely used in modern microelectronic applications. In X-ray diffraction experiments to determine both the residual and applied stresses in nanocrystalline coatings, one difficult challenge that comes up invariably is the determination of the strain-free lattice spacing d{sub o}. The present study addresses this challenge by using the focused ion beam (FIB) to generate a built-in strain-free reference by patterning (milling) a 50 × 50 μm{sup 2} region of the coating to produce an array of small stress-relieved “islands” ∼ 0.8 × 0.8 μm{sup 2} each. Transmission X-ray diffraction setup was used for data collection at DIFFABS beamline (Synchrotron SOLEIL, France). A 150 nm-thick multi-layered W–Cu nano-composite thin film on polyimide (Kapton®) substrate was studied. The samples were loaded incrementally using a compact uniaxial loading device, and micro-beam diffraction data were collected on and away from the reference array. It was shown experimentally that the “island” array remained approximately strain free throughout the experiment, providing an on-board d{sub o} lattice spacing reference. The changing lattice spacing d in the coating was also monitored away from the array, to deduce the elastic strain evolution during deformation. The results and their implications are presented and discussed. - Highlights: • In situ deformation study of laminate polycrystalline W–Cu thin films • Focused ion beam (FIB) patterning of an array of “islands” on thin films surface • X-ray diffraction on island-patterned region • Constant strain on “islands” independently of the deformation of the substrate.

  18. Numerical comparison of grid pattern diffraction effects through measurement and modeling with OptiScan software

    Science.gov (United States)

    Murray, Ian B.; Densmore, Victor; Bora, Vaibhav; Pieratt, Matthew W.; Hibbard, Douglas L.; Milster, Tom D.

    2011-06-01

    Coatings of various metalized patterns are used for heating and electromagnetic interference (EMI) shielding applications. Previous work has focused on macro differences between different types of grids, and has shown good correlation between measurements and analyses of grid diffraction. To advance this work, we have utilized the University of Arizona's OptiScan software, which has been optimized for this application by using the Babinet Principle. When operating on an appropriate computer system, this algorithm produces results hundreds of times faster than standard Fourier-based methods, and allows realistic cases to be modeled for the first time. By using previously published derivations by Exotic Electro-Optics, we compare diffraction performance of repeating and randomized grid patterns with equivalent sheet resistance using numerical performance metrics. Grid patterns of each type are printed on optical substrates and measured energy is compared against modeled energy.

  19. Analysis of Arbitrary Reflector Antennas Applying the Geometrical Theory of Diffraction Together with the Master Points Technique

    Directory of Open Access Journals (Sweden)

    María Jesús Algar

    2013-01-01

    Full Text Available An efficient approach for the analysis of surface conformed reflector antennas fed arbitrarily is presented. The near field in a large number of sampling points in the aperture of the reflector is obtained applying the Geometrical Theory of Diffraction (GTD. A new technique named Master Points has been developed to reduce the complexity of the ray-tracing computations. The combination of both GTD and Master Points reduces the time requirements of this kind of analysis. To validate the new approach, several reflectors and the effects on the radiation pattern caused by shifting the feed and introducing different obstacles have been considered concerning both simple and complex geometries. The results of these analyses have been compared with the Method of Moments (MoM results.

  20. Orientation effects on indexing of electron backscatter diffraction patterns

    International Nuclear Information System (INIS)

    Nowell, Matthew M.; Wright, Stuart I.

    2005-01-01

    Automated Electron Backscatter Diffraction (EBSD) has become a well-accepted technique for characterizing the crystallographic orientation aspects of polycrystalline microstructures. At the advent of this technique, it was observed that patterns obtained from grains in certain crystallographic orientations were more difficult for the automated indexing algorithms to accurately identify than patterns from other orientations. The origin of this problem is often similarities between the EBSD pattern of the correct orientation and patterns from other orientations or phases. While practical solutions have been found and implemented, the identification of these problem orientations generally occurs only after running an automated scan, as problem orientations are often readily apparent in the resulting orientation maps. However, such an approach only finds those problem orientations that are present in the scan area. It would be advantageous to identify all regions of orientation space that may present problems for automated indexing prior to initiating an automated scan, and to minimize this space through the optimization of acquisition and indexing parameters. This work presents new methods for identifying regions in orientation space where the reliability of the automated indexing is suspect prior to performing a scan. This methodology is used to characterize the impact of various parameters on the indexing algorithm

  1. Quantitative phase analysis by neutron diffraction

    Energy Technology Data Exchange (ETDEWEB)

    Lee, Chang Hee; Song, Su Ho; Lee, Jin Ho; Shim, Hae Seop [Korea Atomic Energy Research Institute, Taejon (Korea)

    1999-06-01

    This study is to apply quantitative phase analysis (QPA) by neutron diffraction to the round robin samples provided by the International Union of Crystallography(IUCr). We measured neutron diffraction patterns for mixed samples which have several different weight percentages and their unique characteristic features. Neutron diffraction method has been known to be superior to its complementary methods such as X-ray or Synchrotron, but it is still accepted as highly reliable under limited conditions or samples. Neutron diffraction has strong capability especially on oxides due to its scattering cross-section of the oxygen and it can become a more strong tool for analysis on the industrial materials with this quantitative phase analysis techniques. By doing this study, we hope not only to do one of instrument performance tests on our HRPD but also to improve our ability on the analysis of neutron diffraction data by comparing our QPA results with others from any advanced reactor facilities. 14 refs., 4 figs., 6 tabs. (Author)

  2. A deep convolutional neural network to analyze position averaged convergent beam electron diffraction patterns.

    Science.gov (United States)

    Xu, W; LeBeau, J M

    2018-05-01

    We establish a series of deep convolutional neural networks to automatically analyze position averaged convergent beam electron diffraction patterns. The networks first calibrate the zero-order disk size, center position, and rotation without the need for pretreating the data. With the aligned data, additional networks then measure the sample thickness and tilt. The performance of the network is explored as a function of a variety of variables including thickness, tilt, and dose. A methodology to explore the response of the neural network to various pattern features is also presented. Processing patterns at a rate of  ∼ 0.1 s/pattern, the network is shown to be orders of magnitude faster than a brute force method while maintaining accuracy. The approach is thus suitable for automatically processing big, 4D STEM data. We also discuss the generality of the method to other materials/orientations as well as a hybrid approach that combines the features of the neural network with least squares fitting for even more robust analysis. The source code is available at https://github.com/subangstrom/DeepDiffraction. Copyright © 2018 Elsevier B.V. All rights reserved.

  3. Quantitative multiphase analysis of archaeological bronzes by neutron diffraction

    CERN Document Server

    Siano, S; Celli, M; Pini, R; Salimbeni, R; Zoppi, M; Kockelmann, W A; Iozzo, M; Miccio, M; Moze, O

    2002-01-01

    In this paper, we report the first investigation on the potentials of neutron diffraction to characterize archaeological bronze artifacts. The preliminary feasibility of phase and structural analysis was demonstrated on standardised specimens with a typical bronze alloy composition. These were realised through different hardening and annealing cycles, simulating possible ancient working techniques. The Bragg peak widths that resulted were strictly dependent on the working treatment, thus providing an important analytical element to investigate ancient making techniques. The diagnostic criteria developed on the standardised specimens were then applied to study two Etruscan museum pieces. Quantitative multiphase analysis by Rietveld refinement of the diffraction patterns was successfully demonstrated. Furthermore, the analysis of patterns associated with different artifact elements also yielded evidence for some peculiar perspective of the neutron diffraction diagnostics in archeometric applications. (orig.)

  4. Diffraction by disordered polycrystalline fibers

    International Nuclear Information System (INIS)

    Stroud, W.J.; Millane, R.P.

    1995-01-01

    X-ray diffraction patterns from some polycrystalline fibers show that the constituent microcrystallites are disordered. The relationship between the crystal structure and the diffracted intensities is then quite complicated and depends on the precise kind and degree of disorder present. The effects of disorder on diffracted intensities must be included in structure determinations using diffraction data from such specimens. Theory and algorithms are developed here that allow the full diffraction pattern to be calculated for a disordered polycrystalline fiber made up of helical molecules. The model accommodates various kinds of disorder and includes the effects of finite crystallite size and cylindrical averaging of the diffracted intensities from a fiber. Simulations using these methods show how different kinds, or components, of disorder produce particular diffraction effects. General properties of disordered arrays of helical molecules and their effects on diffraction patterns are described. Implications for structure determination are discussed. (orig.)

  5. Dynamical neutron diffraction by curved crystals in the Laue geometry

    International Nuclear Information System (INIS)

    Albertini, G.; Melone, S.; Lagomarsino, S.; Mazkedian, S.; Puliti, P.; Rustichelli, F.

    1977-01-01

    The Taupin dynamical theory of X-ray diffraction by deformed crystals which was previously extended to the neutron diffraction by curved crystals in the Bragg geometry, is applied to calculate neutron diffraction patterns in the Laue geometry. The theoretical results are compared with experimental data on curved silicon crystals. The agreement is quite satisfactory. In the second part a simple model recently presented to describe neutron diffraction properties in the Bragg case is extended to the Laue case. The predictions of such a model are in satisfactory agreement with the rigorous theory and the experimental results. (author)

  6. Classifying and assembling two-dimensional X-ray laser diffraction patterns of a single particle to reconstruct the three-dimensional diffraction intensity function: resolution limit due to the quantum noise

    International Nuclear Information System (INIS)

    Tokuhisa, Atsushi; Taka, Junichiro; Kono, Hidetoshi; Go, Nobuhiro

    2012-01-01

    A new algorithm is developed for reconstructing the high-resolution three-dimensional diffraction intensity function of a globular biological macromolecule from many quantum-noise-limited two-dimensional X-ray laser diffraction patterns, each for an unknown orientation. The structural resolution is expressed as a function of the incident X-ray intensity and quantities characterizing the target molecule. A new two-step algorithm is developed for reconstructing the three-dimensional diffraction intensity of a globular biological macromolecule from many experimentally measured quantum-noise-limited two-dimensional X-ray laser diffraction patterns, each for an unknown orientation. The first step is classification of the two-dimensional patterns into groups according to the similarity of direction of the incident X-rays with respect to the molecule and an averaging within each group to reduce the noise. The second step is detection of common intersecting circles between the signal-enhanced two-dimensional patterns to identify their mutual location in the three-dimensional wavenumber space. The newly developed algorithm enables one to detect a signal for classification in noisy experimental photon-count data with as low as ∼0.1 photons per effective pixel. The wavenumber of such a limiting pixel determines the attainable structural resolution. From this fact, the resolution limit due to the quantum noise attainable by this new method of analysis as well as two important experimental parameters, the number of two-dimensional patterns to be measured (the load for the detector) and the number of pairs of two-dimensional patterns to be analysed (the load for the computer), are derived as a function of the incident X-ray intensity and quantities characterizing the target molecule

  7. Generation of mask patterns for diffractive optical elements using MathematicaTM

    International Nuclear Information System (INIS)

    OShea, D.C.

    1996-01-01

    The generation of binary and grayscale masks used in the fabrication of diffractive optical elements is usually performed using a proprietary piece of software or a computer-aided drafting package. Once the pattern is computed or designed, it must be output to a plotting or imaging system that will produce a reticle plate. This article describes a number of short Mathematica modules that can be used to generate binary and grayscale patterns in a PostScript-compatible format. Approaches to ensure that the patterns are directly related to the function of the element and the design wavelength are discussed. A procedure to preserve the scale of the graphic output when it is transferred to another application is given. Examples of surfaces for a 100 mm effective focal length lens and an Alvarez surface are given. copyright 1996 American Institute of Physics

  8. Study of optical Laue diffraction

    International Nuclear Information System (INIS)

    Chakravarthy, Giridhar; Allam, Srinivasa Rao; Satyanarayana, S. V. M.; Sharan, Alok

    2014-01-01

    We present the study of the optical diffraction pattern of one and two-dimensional gratings with defects, designed using desktop pc and printed on OHP sheet using laser printer. Gratings so prepared, using novel low cost technique provides good visual aid in teaching. Diffraction pattern of the monochromatic light (632.8nm) from the grating so designed is similar to that of x-ray diffraction pattern of crystal lattice with point defects in one and two-dimensions. Here both optical and x-ray diffractions are Fraunhofer. The information about the crystalline lattice structure and the defect size can be known

  9. Study of optical Laue diffraction

    Energy Technology Data Exchange (ETDEWEB)

    Chakravarthy, Giridhar, E-mail: cgiridhar84@gmail.com, E-mail: aloksharan@email.com; Allam, Srinivasa Rao, E-mail: cgiridhar84@gmail.com, E-mail: aloksharan@email.com; Satyanarayana, S. V. M., E-mail: cgiridhar84@gmail.com, E-mail: aloksharan@email.com; Sharan, Alok, E-mail: cgiridhar84@gmail.com, E-mail: aloksharan@email.com [Department of Physics, Pondicherry University, Puducherry-605014 (India)

    2014-10-15

    We present the study of the optical diffraction pattern of one and two-dimensional gratings with defects, designed using desktop pc and printed on OHP sheet using laser printer. Gratings so prepared, using novel low cost technique provides good visual aid in teaching. Diffraction pattern of the monochromatic light (632.8nm) from the grating so designed is similar to that of x-ray diffraction pattern of crystal lattice with point defects in one and two-dimensions. Here both optical and x-ray diffractions are Fraunhofer. The information about the crystalline lattice structure and the defect size can be known.

  10. Electron diffraction from carbon nanotubes

    International Nuclear Information System (INIS)

    Qin, L-C

    2006-01-01

    The properties of a carbon nanotube are dependent on its atomic structure. The atomic structure of a carbon nanotube can be defined by specifying its chiral indices (u, v), that specify its perimeter vector (chiral vector), with which the diameter and helicity are also determined. The fine electron beam available in a modern transmission electron microscope (TEM) offers a unique probe to reveal the atomic structure of individual nanotubes. This review covers two aspects related to the use of the electron probe in the TEM for the study of carbon nanotubes: (a) to understand the electron diffraction phenomena for inter-pretation of the electron diffraction patterns of carbon nanotubes and (b) to obtain the chiral indices (u, v), of the carbon nanotubes from the electron diffraction patterns. For a nanotube of a given structure, the electron scattering amplitude from the carbon nanotube is first described analytically in closed form using the helical diffraction theory. From a known structure as given by the chiral indices (u, v), its electron diffraction pattern can be calculated and understood. The reverse problem, i.e. assignment of the chiral indices from an electron diffraction pattern of a carbon nanotube, is approached from the relationship between the electron scattering intensity distribution and the chiral indices (u, v). We show that electron diffraction patterns can provide an accurate and unambiguous assignment of the chiral indices of carbon nanotubes. The chiral indices (u, v) can be read indiscriminately with a high accuracy from the intensity distribution on the principal layer lines in an electron diffraction pattern. The symmetry properties of electron diffraction from carbon nanotubes and the electron diffraction from deformed carbon nanotubes are also discussed in detail. It is shown that 2mm symmetry is always preserved for single-walled carbon nanotubes, but it can break down for multiwalled carbon nanotubes under some special circumstances

  11. New imaging technique based on diffraction of a focused x-ray beam

    Energy Technology Data Exchange (ETDEWEB)

    Kazimirov, A [Cornell High Energy Synchrotron Source (CHESS), Cornell University, Ithaca, NY 14853 (United States); Kohn, V G [Russian Research Center ' Kurchatov Institute, 123182 Moscow (Russian Federation); Cai, Z-H [Advanced Photon Source, 9700 S. Cass Avenue, Argonne, IL 60439 (United States)], E-mail: ayk7@cornell.edu

    2009-01-07

    We present first experimental results from a new diffraction depth-sensitive imaging technique. It is based on the diffraction of a focused x-ray beam from a crystalline sample and recording the intensity pattern on a high-resolution CCD detector positioned at a focal plane. Structural non-uniformity inside the sample results in a region of enhanced intensity in the diffraction pattern. The technique was applied to study silicon-on-insulator thin layers of various thicknesses which revealed a complex strain profile within the layers. A circular Fresnel zone plate was used as a focusing optic. Incoherent diffuse scattering spreads out of the diffraction plane and results in intensity recorded outside of the focal spot providing a new approach to separately register x-rays scattered coherently and incoherently from the sample. (fast track communication)

  12. An efficient and novel computation method for simulating diffraction patterns from large-scale coded apertures on large-scale focal plane arrays

    Science.gov (United States)

    Shrekenhamer, Abraham; Gottesman, Stephen R.

    2012-10-01

    A novel and memory efficient method for computing diffraction patterns produced on large-scale focal planes by largescale Coded Apertures at wavelengths where diffraction effects are significant has been developed and tested. The scheme, readily implementable on portable computers, overcomes the memory limitations of present state-of-the-art simulation codes such as Zemax. The method consists of first calculating a set of reference complex field (amplitude and phase) patterns on the focal plane produced by a single (reference) central hole, extending to twice the focal plane array size, with one such pattern for each Line-of-Sight (LOS) direction and wavelength in the scene, and with the pattern amplitude corresponding to the square-root of the spectral irradiance from each such LOS direction in the scene at selected wavelengths. Next the set of reference patterns is transformed to generate pattern sets for other holes. The transformation consists of a translational pattern shift corresponding to each hole's position offset and an electrical phase shift corresponding to each hole's position offset and incoming radiance's direction and wavelength. The set of complex patterns for each direction and wavelength is then summed coherently and squared for each detector to yield a set of power patterns unique for each direction and wavelength. Finally the set of power patterns is summed to produce the full waveband diffraction pattern from the scene. With this tool researchers can now efficiently simulate diffraction patterns produced from scenes by large-scale Coded Apertures onto large-scale focal plane arrays to support the development and optimization of coded aperture masks and image reconstruction algorithms.

  13. The crystal structures and powder diffraction patterns of the uranium tellurides

    Energy Technology Data Exchange (ETDEWEB)

    Snyder, R.L. (State Univ. of New York, Alfred, NY (USA). Inst. of Ceramic Superconductivity); Nichols, M.C.; Boehme, D.R. (Sandia National Labs., Livermore, CA (USA))

    1990-10-03

    A critical review of all of the reported structures and powder diffraction patterns in the uranium telluride system has been undertaken. Structures that are correct: Cubic -- UTe: no experimental pattern exists. Retain calculated 15--865. Cubic --U{sub 3}Te{sub 4}: retain the poor quality 12--610 but adopt the pattern calculated here. Cubic U{sub 2}Te{sub 3}: no experimental pattern exists. Adopt pattern calculated here. Orthorhombic UTe{sub 2}: Adopt the new pattern of Boehme et al. Monoclinic {alpha}UTe{sub 3} Adopt the new pattern of Boehme et al. Monoclinic {alpha}UTe{sub 3} Adopt the new pattern of Boehme et al. Orthorhombic {beta}UTe{sub 3}: Adopt pattern calculated here. Orthorhombic UTe{sub 5}: Adopt the new pattern of Boehme et al. Structures in need of refinement: Orthorhombic U{sub 2}Te{sub 3}:Adopt pattern calculated here over 34--807. Hexagonal U{sub 7}Te{sub 12}: Adopt pattern calculated here but retain 24--1368. Orthorhombic UTe{sub 1.78}: Adopt pattern calculated here and retain our modified 21--1404 reported for U{sub 4}Te{sub 7}. Orthorhombic UTe{sub 2.5}: Adopt pattern calculated here. Orthorhombic UTe{sub 3.4}: Accept recent pattern of Boehme et al. Phases for which no structures or reliable patterns exist: Orthorhombic U{sub 3}Te{sub 4}: no published pattern. Tetragonal U{sub 3}Te{sub 5}: three patterns 21--1407, 34--766 and 34--896 exit but all are of very poor quality. Phases which probably do not exist: Tetragonal UTe{sub 1.78}, Tetragonal UTe{sub 2}, Cubic UTe{sub 2} U{sub 3}Te{sub 7}(21--1402), U{sub 3}Te{sub 8}(21--1406).

  14. Contrast of HOLZ lines in energy-filtered convergent-beam electron diffraction patterns from silicon

    International Nuclear Information System (INIS)

    Lehmpfuhl, G.; Krahl, D.; Uchida, Y.

    1995-01-01

    Higher-order Laue-zone (HOLZ) lines were investigated in convergent-beam electron diffraction patterns from silicon near the low-indexed zone axes [100], [110] and [111]. The visibility of these lines depends on the effective structure potentials of the reflections from the first Laue zone depending on their Debye-Waller factor. The contrast of the HOLZ lines is strongly reduced by inelastically scattered electrons. They can be excluded by an imaging Ω filter for energy losses above 2 eV. The diffraction patterns were compared with many-beam calculations. Without absorption, an excellent agreement could be achieved for the [111] and [100] zone axes, while the simulation of the [110] zone-axis pattern needed a calculation with absorption. The reason for this observation is explained in the Bloch-wave picture. Calculations with absorption, however, lead to artefacts in the intensity distribution of the [100] HOLZ pattern. In order to obtain agreement with the experiment, the Debye-Waller factor had to be modified in different ways for the different zone axes. This corresponds to a strong anisotropy of the Debye-Waller factor. To confirm this observation, the temperature dependence of the itensity distributions of the HOLZ patterns was investigated between 50 and 680 K. At room temperature, the parameter D in the Debye-Waller factor exp(-Ds 2 ) was determined as 0.13, 0.26 and 0.55 A 2 for the zone axes [100], [111] and [110], respectively. The reliability of the conclusions is discussed. (orig.)

  15. When holography meets coherent diffraction imaging.

    Science.gov (United States)

    Latychevskaia, Tatiana; Longchamp, Jean-Nicolas; Fink, Hans-Werner

    2012-12-17

    phase problem can be solved in a fast and unambiguous manner. We demonstrate the reconstruction of various diffraction patterns of objects recorded with visible light as well as with low-energy electrons. Although we have demonstrated our HCDI method using laser light and low-energy electrons, it can also be applied to any other coherent radiation such as X-rays or high-energy electrons.

  16. Emergence of Fresnel diffraction zones in gravitational lensing by a cosmic string

    Energy Technology Data Exchange (ETDEWEB)

    Fernández-Núñez, Isabel [Departament de Física Quàntica i Astrofísica, Facultat de Física, Universitat de Barcelona, Martí i Franquès 1, E-08028 Barcelona (Spain); Institut de Ciències del Cosmos (ICCUB), Facultat de Física, Universitat de Barcelona, Martí i Franquès 1, E-08028 Barcelona (Spain); Bulashenko, Oleg, E-mail: oleg.bulashenko@ub.edu [Departament de Física Quàntica i Astrofísica, Facultat de Física, Universitat de Barcelona, Martí i Franquès 1, E-08028 Barcelona (Spain)

    2017-06-09

    The possibility to detect cosmic strings – topological defects of early Universe, by means of wave effects in gravitational lensing is discussed. To find the optimal observation conditions, we define the hyperbolic-shaped Fresnel observation zones associated with the diffraction maxima and analyse the frequency patterns of wave amplification corresponding to different alignments. In particular, we show that diffraction of gravitational waves by the string may lead to significant amplification at cosmological distances. The wave properties we found are quite different from what one would expect, for instance, from light scattered off a thin wire or slit, since a cosmic string, as a topological defect, gives no shadow at all. - Highlights: • Interference and diffraction of gravitational waves by a cosmic string are studied. • Uniform asymptotic theory of diffraction is applied for a finite distance source. • Hyperbolic-shaped Fresnel observation zones associated with maxima of diffraction. • Frequency patterns modulated by diffraction for different string alignments are given. • The method is applicable to condensed-matter defects and other types of waves.

  17. Teaching Fraunhofer diffraction via experimental and simulated images in the laboratory

    Science.gov (United States)

    Peinado, Alba; Vidal, Josep; Escalera, Juan Carlos; Lizana, Angel; Campos, Juan; Yzuel, Maria

    2012-10-01

    Diffraction is an important phenomenon introduced to Physics university students in a subject of Fundamentals of Optics. In addition, in the Physics Degree syllabus of the Universitat Autònoma de Barcelona, there is an elective subject in Applied Optics. In this subject, diverse diffraction concepts are discussed in-depth from different points of view: theory, experiments in the laboratory and computing exercises. In this work, we have focused on the process of teaching Fraunhofer diffraction through laboratory training. Our approach involves students working in small groups. They visualize and acquire some important diffraction patterns with a CCD camera, such as those produced by a slit, a circular aperture or a grating. First, each group calibrates the CCD camera, that is to say, they obtain the relation between the distances in the diffraction plane in millimeters and in the computer screen in pixels. Afterwards, they measure the significant distances in the diffraction patterns and using the appropriate diffraction formalism, they calculate the size of the analyzed apertures. Concomitantly, students grasp the convolution theorem in the Fourier domain by analyzing the diffraction of 2-D gratings of elemental apertures. Finally, the learners use a specific software to simulate diffraction patterns of different apertures. They can control several parameters: shape, size and number of apertures, 1-D or 2-D gratings, wavelength, focal lens or pixel size.Therefore, the program allows them to reproduce the images obtained experimentally, and generate others by changingcertain parameters. This software has been created in our research group, and it is freely distributed to the students in order to help their learning of diffraction. We have observed that these hands on experiments help students to consolidate their theoretical knowledge of diffraction in a pedagogical and stimulating learning process.

  18. A high-transparency, micro-patternable chip for X-ray diffraction analysis of microcrystals under native growth conditions

    Energy Technology Data Exchange (ETDEWEB)

    Murray, Thomas D. [University of California, Berkeley, CA 94720 (United States); Johns Hopkins University School of Medicine, Baltimore, MD 21205 (United States); Lyubimov, Artem Y. [Stanford University, Stanford, CA 94305 (United States); Ogata, Craig M. [Argonne National Laboratory, Argonne, IL 60439 (United States); Vo, Huy [Johns Hopkins University, Baltimore, MD 21205 (United States); Uervirojnangkoorn, Monarin; Brunger, Axel T., E-mail: brunger@stanford.edu [Stanford University, Stanford, CA 94305 (United States); Berger, James M., E-mail: brunger@stanford.edu [Johns Hopkins University School of Medicine, Baltimore, MD 21205 (United States); University of California, Berkeley, CA 94720 (United States)

    2015-09-26

    A highly X-ray-transparent, silicon nitride-based device has been designed and fabricated to harvest protein microcrystals for high-resolution X-ray diffraction data collection using microfocus beamlines and XFELs. Microcrystals present a significant impediment to the determination of macromolecular structures by X-ray diffraction methods. Although microfocus synchrotron beamlines and X-ray free-electron lasers (XFELs) can enable the collection of interpretable diffraction data from microcrystals, there is a need for efficient methods of harvesting small volumes (<2 µl) of microcrystals grown under common laboratory formats and delivering them to an X-ray beam source under native growth conditions. One approach that shows promise in overcoming the challenges intrinsic to microcrystal analysis is to pair so-called ‘fixed-target’ sample-delivery devices with microbeam-based X-ray diffraction methods. However, to record weak diffraction patterns it is necessary to fabricate devices from X-ray-transparent materials that minimize background scattering. Presented here is the design of a new micro-diffraction device consisting of three layers fabricated from silicon nitride, photoresist and polyimide film. The chip features low X-ray scattering and X-ray absorption properties, and uses a customizable blend of hydrophobic and hydrophilic surface patterns to help localize microcrystals to defined regions. Microcrystals in their native growth conditions can be loaded into the chips with a standard pipette, allowing data collection at room temperature. Diffraction data collected from hen egg-white lysozyme microcrystals (10–15 µm) loaded into the chips yielded a complete, high-resolution (<1.6 Å) data set sufficient to determine a high-quality structure by molecular replacement. The features of the chip allow the rapid and user-friendly analysis of microcrystals grown under virtually any laboratory format at microfocus synchrotron beamlines and XFELs.

  19. A high-transparency, micro-patternable chip for X-ray diffraction analysis of microcrystals under native growth conditions

    International Nuclear Information System (INIS)

    Murray, Thomas D.; Lyubimov, Artem Y.; Ogata, Craig M.; Vo, Huy; Uervirojnangkoorn, Monarin; Brunger, Axel T.; Berger, James M.

    2015-01-01

    A highly X-ray-transparent, silicon nitride-based device has been designed and fabricated to harvest protein microcrystals for high-resolution X-ray diffraction data collection using microfocus beamlines and XFELs. Microcrystals present a significant impediment to the determination of macromolecular structures by X-ray diffraction methods. Although microfocus synchrotron beamlines and X-ray free-electron lasers (XFELs) can enable the collection of interpretable diffraction data from microcrystals, there is a need for efficient methods of harvesting small volumes (<2 µl) of microcrystals grown under common laboratory formats and delivering them to an X-ray beam source under native growth conditions. One approach that shows promise in overcoming the challenges intrinsic to microcrystal analysis is to pair so-called ‘fixed-target’ sample-delivery devices with microbeam-based X-ray diffraction methods. However, to record weak diffraction patterns it is necessary to fabricate devices from X-ray-transparent materials that minimize background scattering. Presented here is the design of a new micro-diffraction device consisting of three layers fabricated from silicon nitride, photoresist and polyimide film. The chip features low X-ray scattering and X-ray absorption properties, and uses a customizable blend of hydrophobic and hydrophilic surface patterns to help localize microcrystals to defined regions. Microcrystals in their native growth conditions can be loaded into the chips with a standard pipette, allowing data collection at room temperature. Diffraction data collected from hen egg-white lysozyme microcrystals (10–15 µm) loaded into the chips yielded a complete, high-resolution (<1.6 Å) data set sufficient to determine a high-quality structure by molecular replacement. The features of the chip allow the rapid and user-friendly analysis of microcrystals grown under virtually any laboratory format at microfocus synchrotron beamlines and XFELs

  20. Computer x-ray powder diffraction patterns and densities for corundum, aluminium, zirconium, delta-UZr2 and the zirconium hydrides

    International Nuclear Information System (INIS)

    Ferguson, I.F.

    1976-11-01

    The computer-calculated X-ray powder diffraction patterns and theoretical densities of α-Al 2 O 3 ; Al; α-Zr; β-Zr; delta-UZr 2 ; γ, delta - and epsilon-zirconium hydrides are presented. Brief comments are given on some of the published X-ray powder diffraction data on these phases. (author)

  1. Calculation of diffraction patterns associated with electron irradiation induced amorphization of CuTi

    International Nuclear Information System (INIS)

    Devanathan, R.; Meshii, M.; Sabochik, M.J.

    1990-11-01

    A new approach that uses the multislice method in conjunction with molecular dynamics simulations to study electron irradiation induced amorphisation is presented. Diffraction patterns were calculated for CuTi and found to be more sensitive than the pair correlation function to the structural changes preceding amorphisation. The results from this approach and from a study of long range order are presented. 16 refs., 8 figs

  2. Data processing software suite SITENNO for coherent X-ray diffraction imaging using the X-ray free-electron laser SACLA

    International Nuclear Information System (INIS)

    Sekiguchi, Yuki; Oroguchi, Tomotaka; Takayama, Yuki; Nakasako, Masayoshi

    2014-01-01

    The software suite SITENNO is developed for processing diffraction data collected in coherent X-ray diffraction imaging experiments of non-crystalline particles using an X-ray free-electron laser. Coherent X-ray diffraction imaging is a promising technique for visualizing the structures of non-crystalline particles with dimensions of micrometers to sub-micrometers. Recently, X-ray free-electron laser sources have enabled efficient experiments in the ‘diffraction before destruction’ scheme. Diffraction experiments have been conducted at SPring-8 Angstrom Compact free-electron LAser (SACLA) using the custom-made diffraction apparatus KOTOBUKI-1 and two multiport CCD detectors. In the experiments, ten thousands of single-shot diffraction patterns can be collected within several hours. Then, diffraction patterns with significant levels of intensity suitable for structural analysis must be found, direct-beam positions in diffraction patterns determined, diffraction patterns from the two CCD detectors merged, and phase-retrieval calculations for structural analyses performed. A software suite named SITENNO has been developed to semi-automatically apply the four-step processing to a huge number of diffraction data. Here, details of the algorithm used in the suite are described and the performance for approximately 9000 diffraction patterns collected from cuboid-shaped copper oxide particles reported. Using the SITENNO suite, it is possible to conduct experiments with data processing immediately after the data collection, and to characterize the size distribution and internal structures of the non-crystalline particles

  3. Undergraduate experiment with fractal diffraction gratings

    International Nuclear Information System (INIS)

    Monsoriu, Juan A; Furlan, Walter D; Pons, Amparo; Barreiro, Juan C; Gimenez, Marcos H

    2011-01-01

    We present a simple diffraction experiment with fractal gratings based on the triadic Cantor set. Diffraction by fractals is proposed as a motivating strategy for students of optics in the potential applications of optical processing. Fraunhofer diffraction patterns are obtained using standard equipment present in most undergraduate physics laboratories and compared with those obtained with conventional periodic gratings. It is shown that fractal gratings produce self-similar diffraction patterns which can be evaluated analytically. Good agreement is obtained between experimental and numerical results.

  4. The X-ray powder diffraction pattern and lattice parameters of perovskite

    International Nuclear Information System (INIS)

    Ball, C.J.; Napier, J.G.

    1988-02-01

    The interplanar spacings and intensities of all lines appearing in the X-ray powder diffraction pattern of perovskite have been calculated. Many of the lines occur in groups with a large amount of overlap. As an aid to identifying the lines which are observed, the intensity profiles of the major groups have been plotted. Those lines which are relatively free of overlap and can be identified unambiguously have been used to calculate the lattice parameters, with the results a=5.4424 ± 0.0001 A, b=7.6417 ± 0.0002 A, c=5.3807 ± 0.0001 A

  5. Diffraction by m-bonacci gratings

    International Nuclear Information System (INIS)

    Monsoriu, Juan A; Giménez, Marcos H; Furlan, Walter D; Barreiro, Juan C; Saavedra, Genaro

    2015-01-01

    We present a simple diffraction experiment with m-bonacci gratings as a new interesting generalization of the Fibonacci ones. Diffraction by these non-conventional structures is proposed as a motivational strategy to introduce students to basic research activities. The Fraunhofer diffraction patterns are obtained with the standard equipment present in most undergraduate physics labs and are compared with those obtained with regular periodic gratings. We show that m-bonacci gratings produce discrete Fraunhofer patterns characterized by a set of diffraction peaks which positions are related to the concept of a generalized golden mean. A very good agreement is obtained between experimental and numerical results and the students’ feedback is discussed. (paper)

  6. Development of splitting convergent beam electron diffraction (SCBED)

    Energy Technology Data Exchange (ETDEWEB)

    Houdellier, Florent, E-mail: Florent.Houdellier@cemes.fr [CEMES-CNRS, 29 Rue Jeanne Marvig, 31055 Toulouse (France); Röder, Falk [CEMES-CNRS, 29 Rue Jeanne Marvig, 31055 Toulouse (France); Triebenberg Lab, Institut für Strukturphysik, Technische Universität Dresden, D-01062 Dresden (Germany); Snoeck, Etienne [CEMES-CNRS, 29 Rue Jeanne Marvig, 31055 Toulouse (France)

    2015-12-15

    Using a combination of condenser electrostatic biprism with dedicated electron optic conditions for sample illumination, we were able to split a convergent beam electron probe focused on the sample in two half focused probes without introducing any tilt between them. As a consequence, a combined convergent beam electron diffraction pattern is obtained in the back focal plane of the objective lens arising from two different sample areas, which could be analyzed in a single pattern. This splitting convergent beam electron diffraction (SCBED) pattern has been tested first on a well-characterized test sample of Si/SiGe multilayers epitaxially grown on a Si substrate. The SCBED pattern contains information from the strained area, which exhibits HOLZ lines broadening induced by surface relaxation, with fine HOLZ lines observed in the unstrained reference part of the sample. These patterns have been analyzed quantitatively using both parts of the SCBED transmitted disk. The fine HOLZ line positions are used to determine the precise acceleration voltage of the microscope while the perturbed HOLZ rocking curves in the stained area are compared to dynamical simulated ones. The combination of these two information leads to a precise evaluation of the sample strain state. Finally, several SCBED setups are proposed to tackle fundamental physics questions as well as applied materials science ones and demonstrate how SCBED has the potential to greatly expand the range of applications of electron diffraction and electron holography. - Highlights: • Using a condenser biprism, we split the CBED pattern in two half-CBED disks. • We have determined the electron optical conditions used to perform various SCBED. • We propose new applications possible for this new SCBED configuration.

  7. X-ray diffraction patterns of single crystals implanted with high-energy light ions

    International Nuclear Information System (INIS)

    Wieteska, K.

    1998-01-01

    X-ray diffraction patterns of silicon and gallium arsenide single crystals implanted with high-energy protons and α-particles were studied. A various models of lattice parameter changes were analysed. The agreement between the simulation and experiment proves that the lattice parameter depth-distribution can be assumed to be proportional to vacancy distribution obtained by Monte-Carlo method and from the Biersack-Ziegler theory. Most of the X-ray experiments were performed using synchrotron source of X-ray radiation in particular in the case of back-reflection and transmission section topographic methods. The new method of direct determination of the implanted ion ranges was proposed using synchrotron radiation back-reflection section topography. A number of new interference phenomena was revealed and explained. These interferences are important in the applications of diffraction theory in studying of the real structure of implanted layers. (author)

  8. Advancements of diffraction-based overlay metrology for double patterning

    Science.gov (United States)

    Li, Jie; Kritsun, Oleg; Liu, Yongdong; Dasari, Prasad; Weher, Ulrich; Volkman, Catherine; Mazur, Martin; Hu, Jiangtao

    2011-03-01

    As the dimensions of integrated circuit continue to shrink, diffraction based overlay (DBO) technologies have been developed to address the tighter overlay control challenges. Previously data of high accuracy and high precision were reported for litho-etch-litho-etch double patterning (DP) process using normal incidence spectroscopic reflectometry on specially designed targets composed of 1D gratings in x and y directions. Two measurement methods, empirical algorithm (eDBO) using four pads per direction (2x4 target) and modeling based algorithm (mDBO) using two pads per direction (2x2 target) were performed. In this work, we apply DBO techniques to measure overlay errors for a different DP process, litho-freeze-litho-etch process. We explore the possibility of further reducing number of pads in a DBO target using mDBO. For standard targets composed of 1D gratings, we reported results for eDBO 2x4 targets, mDBO 2x2 targets, and mDBO 2x1 target. The results of all three types of targets are comparable in terms of accuracy, dynamic precision, and TIS. TMU (not including tool matching) is less than 0.1nm. In addition, we investigated the possibility of measuring overlay with one single pad that contains 2D gratings. We achieved good correlation to blossom measurements. TMU (not including tool matching) is ~ 0.2nm. To our best knowledge, this is the first time that DBO results are reported on a single pad. eDBO allows quick recipe setup but takes more space and measurement time. Although mDBO needs details of optical properties and modeling, it offers smaller total target size and much faster throughput, which is important in high volume manufacturing environment.

  9. XaNSoNS: GPU-accelerated simulator of diffraction patterns of nanoparticles

    Directory of Open Access Journals (Sweden)

    V.S. Neverov

    2017-01-01

    Full Text Available XaNSoNS is an open source software with GPU support, which simulates X-ray and neutron 1D (or 2D diffraction patterns and pair-distribution functions (PDF for amorphous or crystalline nanoparticles (up to ∼107 atoms of heterogeneous structural content. Among the multiple parameters of the structure the user may specify atomic displacements, site occupancies, molecular displacements and molecular rotations. The software uses general equations nonspecific to crystalline structures to calculate the scattering intensity. It supports four major standards of parallel computing: MPI, OpenMP, Nvidia CUDA and OpenCL, enabling it to run on various architectures, from CPU-based HPCs to consumer-level GPUs.

  10. XaNSoNS: GPU-accelerated simulator of diffraction patterns of nanoparticles

    Science.gov (United States)

    Neverov, V. S.

    XaNSoNS is an open source software with GPU support, which simulates X-ray and neutron 1D (or 2D) diffraction patterns and pair-distribution functions (PDF) for amorphous or crystalline nanoparticles (up to ∼107 atoms) of heterogeneous structural content. Among the multiple parameters of the structure the user may specify atomic displacements, site occupancies, molecular displacements and molecular rotations. The software uses general equations nonspecific to crystalline structures to calculate the scattering intensity. It supports four major standards of parallel computing: MPI, OpenMP, Nvidia CUDA and OpenCL, enabling it to run on various architectures, from CPU-based HPCs to consumer-level GPUs.

  11. Signature of dislocations and stacking faults of face-centred cubic nanocrystals in coherent X-ray diffraction patterns: a numerical study.

    Science.gov (United States)

    Dupraz, Maxime; Beutier, Guillaume; Rodney, David; Mordehai, Dan; Verdier, Marc

    2015-06-01

    Crystal defects induce strong distortions in diffraction patterns. A single defect alone can yield strong and fine features that are observed in high-resolution diffraction experiments such as coherent X-ray diffraction. The case of face-centred cubic nanocrystals is studied numerically and the signatures of typical defects close to Bragg positions are identified. Crystals of a few tens of nanometres are modelled with realistic atomic potentials and 'relaxed' after introduction of well defined defects such as pure screw or edge dislocations, or Frank or prismatic loops. Diffraction patterns calculated in the kinematic approximation reveal various signatures of the defects depending on the Miller indices. They are strongly modified by the dissociation of the dislocations. Selection rules on the Miller indices are provided, to observe the maximum effect of given crystal defects in the initial and relaxed configurations. The effect of several physical and geometrical parameters such as stacking fault energy, crystal shape and defect position are discussed. The method is illustrated on a complex structure resulting from the simulated nanoindentation of a gold nanocrystal.

  12. Tolerance analysis on diffraction efficiency and polychromatic integral diffraction efficiency for harmonic diffractive optics

    Science.gov (United States)

    Shan, Mao

    2016-10-01

    In this dissertation, the mathematical model of effect of manufacturing errors including microstructure relative height error and relative width error on diffraction efficiency for the harmonic diffractive optical elements (HDEs) is set up. According to the expression of the phase delay and diffraction efficiency of the HDEs, the expression of diffraction efficiency of refraction and diffractive optical element with the microstructure height and periodic width errors in fabrication process is presented in this paper. Furthermore, the effect of manufacturing errors on diffraction efficiency for the harmonic diffractive optical elements is studied, and diffraction efficiency change is analyzed as the relative microstructure height-error in the same and in the opposite sign as well as relative width-error in the same and in the opposite sign. Example including infrared wavelength with materials GE has been discussed in this paper. Two kinds of manufacturing errors applied in 3.7 4.3um middle infrared and 8.7-11.5um far infrared optical system which results in diffraction efficiency and PIDE of HDEs are studied. The analysis results can be used for manufacturing error control in micro-structure height and periodic width. Results can be used for HDEs processing.

  13. Appearance of maxima of combined type in Moessbauer diffraction

    International Nuclear Information System (INIS)

    Kolpakov, A.V.; Ovchinnikova, E.N.; Kuz'min, R.N.

    1978-01-01

    An appearance of Bragg maxima in the Moessbauer diffraction pattern due to a combined hyperfine interaction on nuclei in a crystal is discussed. By a combined interaction one means presence on the nuclei of a magnetic field and tensor of electric field gradient. The structure RFe 2 R=Pu, Np, V, Zr, Tm) is considered. It has been shown that when a scattering system is in fields of several actions with various symmetries, the diffraction pattern is not an additive superposition of diffraction patterns of magnetic and electric quadrupole scatterings. In this case the diffraction patterns of magnetic and electric quadrupole scatterings. In this case the diffraction spectra have maxima forbidden by the extinction laws in diffraction in the presence of only a magnetic field or only electric quadrupole interaction

  14. Microbeam high-resolution diffraction and x-ray standing wave methods applied to semiconductor structures

    International Nuclear Information System (INIS)

    Kazimirov, A; Bilderback, D H; Huang, R; Sirenko, A; Ougazzaden, A

    2004-01-01

    A new approach to conditioning x-ray microbeams for high angular resolution x-ray diffraction and scattering techniques is introduced. We combined focusing optics (one-bounce imaging capillary) and post-focusing collimating optics (miniature Si(004) channel-cut crystal) to generate an x-ray microbeam with a size of 10 μm and ultimate angular resolution of 14 μrad. The microbeam was used to analyse the strain in sub-micron thick InGaAsP epitaxial layers grown on an InP(100) substrate by the selective area growth technique in narrow openings between the oxide stripes. For the structures for which the diffraction peaks from the substrate and the film overlap, the x-ray standing wave technique was applied for precise measurements of the strain with a Δd/d resolution of better than 10 -4 . (rapid communication)

  15. A method of combining STEM image with parallel beam diffraction and electron-optical conditions for diffractive imaging

    International Nuclear Information System (INIS)

    He Haifeng; Nelson, Chris

    2007-01-01

    We describe a method of combining STEM imaging functionalities with nanoarea parallel beam electron diffraction on a modern TEM. This facilitates the search for individual particles whose diffraction patterns are needed for diffractive imaging or structural studies of nanoparticles. This also lays out a base for 3D diffraction data collection

  16. X-ray diffraction pattern and relative crystallinity of irradiated arrowroot starch

    Energy Technology Data Exchange (ETDEWEB)

    Barroso, Aline G.; Garcia, Rafael H.L.; Del Mastro, Nelida L., E-mail: nlmastro@ipen.br [Instituto de Pesquisas Energeticas e Nucleares (IPEN/CNEN-SP), Sao Paulo, SP (Brazil)

    2017-11-01

    After cereals, tubers and roots are the major source of starch for food and industrial uses. Arrowroot refers to any plant of the genus Marantha, but the term is most commonly used to describe the easily digested starch obtained from the rhizomes of Marantha arundinacae. The rhizomes of this herbaceous plant contain about 20% of starch. As few studies exist on arrowroot starch, the objective of this preliminary work was to study the X-ray diffraction patterns (XRD) patterns of arrowroot starch when treated by γ-radiation with doses up to 15 kGy in a {sup 60}Co source. The XRD patterns of the arrowroot starch exhibited A-type crystalline arrangements with strong peaks at approximately 15º, 17º, 18º and 23º (2θ). A slight increase of diffractogram peaks intensity was noticed after the irradiation process. The crystallinity index was calculated using Bruker DIFFRAC.EVA version 4.2 software. Relative crystallinity seems to increase with radiation doses, and this effect is more noticeable at low doses. That can be attributed to different radiation sensitivity among the amorphous and crystalline regions of the arrowroot starch molecule. Present results will contribute to elucidate the behavior under radiation treatment of this starchy component increasingly employed by the food industry. (author)

  17. X-ray diffraction pattern and relative crystallinity of irradiated arrowroot starch

    International Nuclear Information System (INIS)

    Barroso, Aline G.; Garcia, Rafael H.L.; Del Mastro, Nelida L.

    2017-01-01

    After cereals, tubers and roots are the major source of starch for food and industrial uses. Arrowroot refers to any plant of the genus Marantha, but the term is most commonly used to describe the easily digested starch obtained from the rhizomes of Marantha arundinacae. The rhizomes of this herbaceous plant contain about 20% of starch. As few studies exist on arrowroot starch, the objective of this preliminary work was to study the X-ray diffraction patterns (XRD) patterns of arrowroot starch when treated by γ-radiation with doses up to 15 kGy in a "6"0Co source. The XRD patterns of the arrowroot starch exhibited A-type crystalline arrangements with strong peaks at approximately 15º, 17º, 18º and 23º (2θ). A slight increase of diffractogram peaks intensity was noticed after the irradiation process. The crystallinity index was calculated using Bruker DIFFRAC.EVA version 4.2 software. Relative crystallinity seems to increase with radiation doses, and this effect is more noticeable at low doses. That can be attributed to different radiation sensitivity among the amorphous and crystalline regions of the arrowroot starch molecule. Present results will contribute to elucidate the behavior under radiation treatment of this starchy component increasingly employed by the food industry. (author)

  18. Diffractive DIS: Where are we?

    International Nuclear Information System (INIS)

    Nikolaev, N.N.

    2001-01-01

    A brief review of the modern QCD theory of diffractive DIS is given. The recent progress has been remarkably rapid, all the principal predictions from the color dipole approach to diffraction - the (Q 2 + m V 2 ) scaling, the pattern of SCHNC, shrinkage of the diffraction cone in hard diffractive DIS, the strong impact of longitudinal gluons in inclusive J/Ψ production at Tevatron - have been confirmed experimentally

  19. INVESTIGATIONS THE EFFECT OF EOSIN B DYE ON X- RAY DIFFRACTION PATTERN OF SILVER NITRATE DOPED PVP FILMS

    Directory of Open Access Journals (Sweden)

    Mahasin F. Hadi Al-Kadhemy

    2017-07-01

    Full Text Available In this research, X-ray diffraction of the powder (PVP polymer, Eosin B dye, and silver nitrate and (EB/PVP, AgNO3/PVP, EB/AgNO3/PVP films have been studied. Casting method is used to prepare homogeneous films on plastic petri dishes. All parameters accounted for the X-ray diffraction; full width half maximum (FWHM, Miller indices (hkl, size of crystalline (D, Specific Surface Area (S and Dislocation Density (δ.The nature of the structural of materials and films will be investigated. The XRD pattern of PVP polymer was amorphous structure with two broader peaks and the Eosin B dye and silver nitrate have crystalline structure. While the mixture between these materials led to appearing some crystalline peaks into XRD pattern of PVP polymer.

  20. Reconstruction of Laser-Induced Surface Topography from Electron Backscatter Diffraction Patterns.

    Science.gov (United States)

    Callahan, Patrick G; Echlin, McLean P; Pollock, Tresa M; De Graef, Marc

    2017-08-01

    We demonstrate that the surface topography of a sample can be reconstructed from electron backscatter diffraction (EBSD) patterns collected with a commercial EBSD system. This technique combines the location of the maximum background intensity with a correction from Monte Carlo simulations to determine the local surface normals at each point in an EBSD scan. A surface height map is then reconstructed from the local surface normals. In this study, a Ni sample was machined with a femtosecond laser, which causes the formation of a laser-induced periodic surface structure (LIPSS). The topography of the LIPSS was analyzed using atomic force microscopy (AFM) and reconstructions from EBSD patterns collected at 5 and 20 kV. The LIPSS consisted of a combination of low frequency waviness due to curtaining and high frequency ridges. The morphology of the reconstructed low frequency waviness and high frequency ridges matched the AFM data. The reconstruction technique does not require any modification to existing EBSD systems and so can be particularly useful for measuring topography and its evolution during in situ experiments.

  1. Classifying and assembling two-dimensional X-ray laser diffraction patterns of a single particle to reconstruct the three-dimensional diffraction intensity function: resolution limit due to the quantum noise.

    Science.gov (United States)

    Tokuhisa, Atsushi; Taka, Junichiro; Kono, Hidetoshi; Go, Nobuhiro

    2012-05-01

    A new two-step algorithm is developed for reconstructing the three-dimensional diffraction intensity of a globular biological macromolecule from many experimentally measured quantum-noise-limited two-dimensional X-ray laser diffraction patterns, each for an unknown orientation. The first step is classification of the two-dimensional patterns into groups according to the similarity of direction of the incident X-rays with respect to the molecule and an averaging within each group to reduce the noise. The second step is detection of common intersecting circles between the signal-enhanced two-dimensional patterns to identify their mutual location in the three-dimensional wavenumber space. The newly developed algorithm enables one to detect a signal for classification in noisy experimental photon-count data with as low as ~0.1 photons per effective pixel. The wavenumber of such a limiting pixel determines the attainable structural resolution. From this fact, the resolution limit due to the quantum noise attainable by this new method of analysis as well as two important experimental parameters, the number of two-dimensional patterns to be measured (the load for the detector) and the number of pairs of two-dimensional patterns to be analysed (the load for the computer), are derived as a function of the incident X-ray intensity and quantities characterizing the target molecule. © 2012 International Union of Crystallography

  2. Effects of focused ion beam milling on electron backscatter diffraction patterns in strontium titanate and stabilized zirconia

    DEFF Research Database (Denmark)

    Saowadee, Nath; Agersted, Karsten; Bowen, Jacob R.

    2012-01-01

    This study investigates the effect of focused ion beam (FIB) current and accelerating voltage on electron backscatter diffraction pattern quality of yttria‐stabilized zirconia (YSZ) and Nb‐doped strontium titanate (STN) to optimize data quality and acquisition time for 3D‐EBSD experiments by FIB...

  3. A FORTRAN program for an IBM PC compatible computer for calculating kinematical electron diffraction patterns

    International Nuclear Information System (INIS)

    Skjerpe, P.

    1989-01-01

    This report describes a computer program which is useful in transmission electron microscopy. The program is written in FORTRAN and calculates kinematical electron diffraction patterns in any zone axis from a given crystal structure. Quite large unit cells, containing up to 2250 atoms, can be handled by the program. The program runs on both the Helcules graphic card and the standard IBM CGA card

  4. Mineralogical applications of electron diffraction. 1. Theory and techniques

    Science.gov (United States)

    Ross, Malcolm; Christ, C.L.

    1958-01-01

    The small wavelengths used in electron-diffraction experiments and the thinness of the crystals necessary for the transmission of the electron beam combine to require a somewhat different diffraction geometry for the interpretation of electron-diffraction patterns than is used in the interpretation of X-ray diffraction patterns. This geometry, based on the reciprocal lattice concept and geometrical construction of Ewald, needed for the interpretation.

  5. Prospect for application of compact accelerator-based neutron source to neutron engineering diffraction

    Energy Technology Data Exchange (ETDEWEB)

    Ikeda, Yoshimasa, E-mail: yoshimasa.ikeda@riken.jp [Center for Advanced Photonics, RIKEN, Wako, Saitama 351-0198 (Japan); Taketani, Atsushi; Takamura, Masato; Sunaga, Hideyuki [Center for Advanced Photonics, RIKEN, Wako, Saitama 351-0198 (Japan); Kumagai, Masayoshi [Faculty of Engineering, Tokyo City University, Setagaya, Tokyo 158-8857 (Japan); Oba, Yojiro [Research Reactor Institute, Kyoto University, Kumatori, Osaka 590-0494 (Japan); Otake, Yoshie [Center for Advanced Photonics, RIKEN, Wako, Saitama 351-0198 (Japan); Suzuki, Hiroshi [Materials Sciences Research Center, Japan Atomic Energy Agency, Tokai, Ibaraki 319-1195 (Japan)

    2016-10-11

    A compact accelerator-based neutron source has been lately discussed on engineering applications such as transmission imaging and small angle scattering as well as reflectometry. However, nobody considers using it for neutron diffraction experiment because of its low neutron flux. In this study, therefore, the neutron diffraction experiments are carried out using Riken Accelerator-driven Compact Neutron Source (RANS), to clarify the capability of the compact neutron source for neutron engineering diffraction. The diffraction pattern from a ferritic steel was successfully measured by suitable arrangement of the optical system to reduce the background noise, and it was confirmed that the recognizable diffraction pattern can be measured by a large sampling volume with 10 mm in cubic for an acceptable measurement time, i.e. 10 min. The minimum resolution of the 110 reflection for RANS is approximately 2.5% at 8 μs of the proton pulse width, which is insufficient to perform the strain measurement by neutron diffraction. The moderation time width at the wavelength corresponding to the 110 reflection is estimated to be approximately 30 μs, which is the most dominant factor to determine the resolution. Therefore, refinements of the moderator system to decrease the moderation time by decreasing a thickness of the moderator or by applying the decoupler system or application of the angular dispersive neutron diffraction technique are important to improve the resolution of the diffraction experiment using the compact neutron source. In contrast, the texture evolution due to plastic deformation was successfully observed by measuring a change in the diffraction peak intensity by RANS. Furthermore, the volume fraction of the austenitic phase in the dual phase mock specimen was also successfully evaluated by fitting the diffraction pattern using a Rietveld code. Consequently, RANS has been proved to be capable for neutron engineering diffraction aiming for the easy access

  6. Undergraduate Experiment with Fractal Diffraction Gratings

    Science.gov (United States)

    Monsoriu, Juan A.; Furlan, Walter D.; Pons, Amparo; Barreiro, Juan C.; Gimenez, Marcos H.

    2011-01-01

    We present a simple diffraction experiment with fractal gratings based on the triadic Cantor set. Diffraction by fractals is proposed as a motivating strategy for students of optics in the potential applications of optical processing. Fraunhofer diffraction patterns are obtained using standard equipment present in most undergraduate physics…

  7. Visible diffraction from quasi-crystalline arrays of carbon nanotubes

    Science.gov (United States)

    Butler, Timothy P.; Butt, Haider; Wilkinson, Timothy D.; Amaratunga, Gehan A. J.

    2015-08-01

    Large area arrays of vertically-aligned carbon nanotubes (VACNTs) are patterned in a quasi-crystalline Penrose tile arrangement through electron beam lithography definition of Ni catalyst dots and subsequent nanotube growth by plasma-enhanced chemical vapour deposition. When illuminated with a 532 nm laser beam high-quality and remarkable diffraction patterns are seen. The diffraction is well matched to theoretical calculations which assume apertures to be present at the location of the VACNTs for transmitted light. The results show that VACNTs act as diffractive elements in reflection and can be used as spatially phased arrays for producing tailored diffraction patterns.

  8. A Monte Carlo error simulation applied to calibration-free X-ray diffraction phase analysis

    International Nuclear Information System (INIS)

    Braun, G.E.

    1986-01-01

    Quantitative phase analysis of a system of n phases can be effected without the need for calibration standards provided at least n different mixtures of these phases are available. A series of linear equations relating diffracted X-ray intensities, weight fractions and quantitation factors coupled with mass balance relationships can be solved for the unknown weight fractions and factors. Uncertainties associated with the measured X-ray intensities, owing to counting of random X-ray quanta, are used to estimate the errors in the calculated parameters utilizing a Monte Carlo simulation. The Monte Carlo approach can be generalized and applied to any quantitative X-ray diffraction phase analysis method. Two examples utilizing mixtures of CaCO 3 , Fe 2 O 3 and CaF 2 with an α-SiO 2 (quartz) internal standard illustrate the quantitative method and corresponding error analysis. One example is well conditioned; the other is poorly conditioned and, therefore, very sensitive to errors in the measured intensities. (orig.)

  9. Diffraction-Enhanced Imaging for studying pattern recognition in cranial ontogeny of bats and marsupials

    International Nuclear Information System (INIS)

    Rocha, H.S.; Lopes, R.T.; Pessoa, L.M.; Hoennicke, M.G.; Tirao, G.; Cusatis, C.; Mazzaro, I.; Giles, C.

    2005-01-01

    The key to understanding evolution lies in the elucidation of mechanisms responsible for the observed underlying patterns and in the observation of sequences that emerge from those evolutionary landmarks. The comparative development can be used to access the derivation of form and the homology versus the convergence of evolution features. Phylogenetic and biological homologies are necessary to discern the evolutionary origins of these features. This work examined the patterns of cranial formation in pre-born bat specimens as well as post-born opossum by means of microradiography and Diffraction-Enhanced Radiography (DER) techniques. A direct conversion CCD camera was used to provide micrometer spatial resolution in order to acquire highly detailed density images. This technique allows the observation of structures, in early stages of development, which were impossible to be observed with traditional techniques, such as clearing and staining. Some cranial features have been described for adults in the literature, but the detailed description of the appearance sequence of those features in these species is still unknown and obscure. Microradiography and diffraction-enhanced imaging can improve quality of morphological detail analysis and permit the identification of anatomical landmarks that are useful in comparative studies and are still unknown in both species. In this study, we access evolution features in cranial morphology of bats and marsupials using both X-ray techniques

  10. Diffraction-Enhanced Imaging for studying pattern recognition in cranial ontogeny of bats and marsupials

    Energy Technology Data Exchange (ETDEWEB)

    Rocha, H.S. [Laboratorio de Instrumentacao Nuclear (LIN), COPPE, UFRJ (Brazil); Lopes, R.T. [Laboratorio de Instrumentacao Nuclear (LIN), COPPE, UFRJ (Brazil)]. E-mail: ricardo@lin.ufrj.br; Pessoa, L.M. [Laboratorio de Mastozoologia, Departamento Zoologia, Instituto de Biologia, UFRJ (Brazil); Hoennicke, M.G. [Laboratorio de Optica de Raios X e Instrumentacao (LORXI) , Departamento de Fisica, UFPR (Brazil); Tirao, G. [Laboratorio de Optica de Raios X e Instrumentacao (LORXI) , Departamento de Fisica, UFPR (Brazil); Faculdad de Mat. Astronomia y Fisica (FAMAF), UNC. Cordoba (Argentina); Cusatis, C. [Laboratorio de Optica de Raios X e Instrumentacao (LORXI) , Departamento de Fisica, UFPR (Brazil); Mazzaro, I. [Laboratorio de Optica de Raios X e Instrumentacao (LORXI) , Departamento de Fisica, UFPR (Brazil); Giles, C. [Laboratorio Nacional de Luz Sincrotron (LNLS)/Laboratorio de Cristalografia Aplicada e Raios X, Instituto de Fisica Gleb Wataghin, UNICAMP (Brazil)

    2005-08-11

    The key to understanding evolution lies in the elucidation of mechanisms responsible for the observed underlying patterns and in the observation of sequences that emerge from those evolutionary landmarks. The comparative development can be used to access the derivation of form and the homology versus the convergence of evolution features. Phylogenetic and biological homologies are necessary to discern the evolutionary origins of these features. This work examined the patterns of cranial formation in pre-born bat specimens as well as post-born opossum by means of microradiography and Diffraction-Enhanced Radiography (DER) techniques. A direct conversion CCD camera was used to provide micrometer spatial resolution in order to acquire highly detailed density images. This technique allows the observation of structures, in early stages of development, which were impossible to be observed with traditional techniques, such as clearing and staining. Some cranial features have been described for adults in the literature, but the detailed description of the appearance sequence of those features in these species is still unknown and obscure. Microradiography and diffraction-enhanced imaging can improve quality of morphological detail analysis and permit the identification of anatomical landmarks that are useful in comparative studies and are still unknown in both species. In this study, we access evolution features in cranial morphology of bats and marsupials using both X-ray techniques.

  11. X-ray diffraction imaging of material microstructures

    KAUST Repository

    Varga, Laszlo

    2016-10-20

    Various examples are provided for x-ray imaging of the microstructure of materials. In one example, a system for non-destructive material testing includes an x-ray source configured to generate a beam spot on a test item; a grid detector configured to receive x- rays diffracted from the test object; and a computing device configured to determine a microstructure image based at least in part upon a diffraction pattern of the x-rays diffracted from the test object. In another example, a method for determining a microstructure of a material includes illuminating a beam spot on the material with a beam of incident x-rays; detecting, with a grid detector, x-rays diffracted from the material; and determining, by a computing device, a microstructure image based at least in part upon a diffraction pattern of the x-rays diffracted from the material.

  12. Towards automated diffraction tomography: Part I-Data acquisition

    International Nuclear Information System (INIS)

    Kolb, U.; Gorelik, T.; Kuebel, C.; Otten, M.T.; Hubert, D.

    2007-01-01

    The ultimate aim of electron diffraction data collection for structure analysis is to sample the reciprocal space as accurately as possible to obtain a high-quality data set for crystal structure determination. Besides a more precise lattice parameter determination, fine sampling is expected to deliver superior data on reflection intensities, which is crucial for subsequent structure analysis. Traditionally, three-dimensional (3D) diffraction data are collected by manually tilting a crystal around a selected crystallographic axis and recording a set of diffraction patterns (a tilt series) at various crystallographic zones. In a second step, diffraction data from these zones are combined into a 3D data set and analyzed to yield the desired structure information. Data collection can also be performed automatically, with the recent advances in tomography acquisition providing a suitable basis. An experimental software module has been developed for the Tecnai microscope for such an automated diffraction pattern collection while tilting around the goniometer axis. The module combines STEM imaging with diffraction pattern acquisition in nanodiffraction mode. It allows automated recording of diffraction tilt series from nanoparticles with a size down to 5 nm

  13. X-ray diffraction 2 - diffraction principles

    International Nuclear Information System (INIS)

    O'Connor, B.

    1999-01-01

    Full text: The computation of powder diffraction intensities is based on the principle that the powder pattern comprises the summation of the intensity contributions from each of the crystallites (or single crystals) in the material. Therefore, it is of value for powder diffractionists to appreciate the form of the expression for calculating single crystal diffraction pattern intensities. This knowledge is especially important for Rietveld analysis practitioners in terms of the (i) mathematics of the method and (ii) retrieving single crystal structure data from the literature. We consider the integrated intensity from a small single crystal being rotated at velocity ω through the Bragg angle θ for reflection (hkl).... I(hkl) = [l o /ω]. [e 4 /m 2 c 4 ]. [λ 3 δV F(hkl) 2 /υ 2 ].[(1+cos 2 2θ)/2sin2θ] where e, m and c are the usual fundamental constants; λ is the x-ray wavelength, δV is the crystallite volume; F(hkl) is the structure factor; υ is the unit cell volume; and (1+cos 2 θ)/2sin2θ] is the Lorentz-polarisation factor for an unpolarised incident beam. The expression does not include a contribution for extinction. The influence of factors λ, δV, F(hkl) and υ on the intensities should be appreciated by powder diffractionists, especially the structure factor, F(hkl), which is responsible for the fingerprint nature of diffraction patterns, such as the rise and fall of intensity from peak to peak. The structure factor expression represents the summation of the scattered waves from each of the j scattering centres (i e atoms) in the unit cell: F(hkl) Σ f j exp[2πi (h.x j +k.y i +l. z i )] T j . Symbol f is the scattering factor (representing the atom-type scattering efficiency); (x, y, z) are the fractional position coordinates of atom j within the unit cell; and T is the thermal vibration factor for the atom given by: T j = 8π 2 2 > sin 2 θ/λ 2 with 2 > being the mean-square vibration amplitude of the atom (assumed to be isotropic). The

  14. The dynamics of diffracted rays in foams

    Energy Technology Data Exchange (ETDEWEB)

    Tufaile, A., E-mail: tufaile@usp.br; Tufaile, A.P.B.

    2015-12-18

    We have studied some aspects of the optics of the light scattering in foams. This paper describes the difference between rays and diffracted rays from the point of view of geometrical theory of diffraction. We have represented some bifurcations of light rays using dynamical systems. Based on our observations of foams, we created a solid optical device. The interference patterns of light scattering in foams forming Airy fringes were explored observing the pattern named as the eye of Horus. In the cases we examine, these Airy fringes are associated with light scattering in curved surfaces, while the halo formation is related to the law of edge diffraction. We are proposing a Pohl interferometer using a three-sided bubble/Plateau border system. - Highlights: • We obtained halos scattering light in foams. • We model the light scattering in foams using the geometrical theory of diffraction. • We examine the difference between rays and the diffracted rays. • We developed optical devices for diffracted rays.

  15. X-diffraction technique applied for nano system metrology

    International Nuclear Information System (INIS)

    Kuznetsov, Alexei Yu.; Machado, Rogerio; Robertis, Eveline de; Campos, Andrea P.C.; Archanjo, Braulio S.; Gomes, Lincoln S.; Achete, Carlos A.

    2009-01-01

    The application of nano materials are fast growing in all industrial sectors, with a strong necessity in nano metrology and normalizing in the nano material area. The great potential of the X-ray diffraction technique in this field is illustrated at the example of metals, metal oxides and pharmaceuticals

  16. Characterization of monoclinic crystals in tablets by pattern-fitting procedure using X-ray powder diffraction data.

    Science.gov (United States)

    Yamamura, Shigeo; Momose, Yasunori

    2003-06-18

    The purpose of this study is to characterize the monoclinic crystals in tablets by using X-ray powder diffraction data and to evaluate the deformation feature of crystals during compression. The monoclinic crystals of acetaminophen and benzoic acid were used as the samples. The observed X-ray diffraction intensities were fitted to the analytic expression, and the fitting parameters, such as the lattice parameters, the peak-width parameters, the preferred orientation parameter and peak asymmetric parameter were optimized by a non-linear least-squares procedure. The Gauss and March distribution functions were used to correct the preferred orientation of crystallites in the tablet. The March function performed better in correcting the modification of diffraction intensity by preferred orientation of crystallites, suggesting that the crystallites in the tablets had fiber texture with axial orientation. Although a broadening of diffraction peaks was observed in acetaminophen tablets with an increase of compression pressure, little broadening was observed in the benzoic tablets. These results suggest that "acetaminophen is a material consolidating by fragmentation of crystalline particles and benzoic acid is a material consolidating by plastic deformation then occurred rearrangement of molecules during compression". A pattern-fitting procedure is the superior method for characterizing the crystalline drugs of monoclinic crystals in the tablets, as well as orthorhombic isoniazid and mannitol crystals reported in the previous paper.

  17. Diffraction by DNA, carbon nanotubes and other helical nanostructures

    International Nuclear Information System (INIS)

    Lucas, Amand A; Lambin, Philippe

    2005-01-01

    This review discusses the diffraction patterns of x-rays or electrons scattered by fibres of helical biological molecules and by carbon nanotubes (CNTs) from the unified point of view of the Fourier-Bessel transform of an atomic helix. This paper is intended for scientists who are not professional crystallographers. X-ray fibre diffraction patterns of Pauling's protein α-helix and of Crick and Pauling's protein coiled-coil are revisited. This is followed by a non-technical comparison between the historic x-ray diffraction patterns of the A and B conformations of DNA, which were crucial for the discovery of the double helix. The qualitative analysis of the diffraction images is supported by novel optical simulation experiments designed to pinpoint the gross structural informational content of the patterns. The spectacular helical structure of the tobacco mosaic virus determined by Rosalind Franklin and co-workers will then be described as an early example of the great power of x-ray crystallography in determining the structure of a large biomolecular edifice. After these mostly historical and didactic case studies, this paper will consider electron diffraction and transmission electron microscopy of CNTs of great current interest, focusing particularly on recent data obtained for single-wall, double-wall and scrolled nanotubes. Several points of convergence between the interpretations of the diffraction patterns of biological helices and CNTs will be emphasized

  18. Advanced diffraction-based overlay for double patterning

    Science.gov (United States)

    Li, Jie; Liu, Yongdong; Dasari, Prasad; Hu, Jiangtao; Smith, Nigel; Kritsun, Oleg; Volkman, Catherine

    2010-03-01

    Diffraction based overlay (DBO) technologies have been developed to address the tighter overlay control challenges as the dimensions of integrated circuit continue to shrink. Several studies published recently have demonstrated that the performance of DBO technologies has the potential to meet the overlay metrology budget for 22nm technology node. However, several hurdles must be cleared before DBO can be used in production. One of the major hurdles is that most DBO technologies require specially designed targets that consist of multiple measurement pads, which consume too much space and increase measurement time. A more advanced spectroscopic ellipsometry (SE) technology-Mueller Matrix SE (MM-SE) is developed to address the challenge. We use a double patterning sample to demonstrate the potential of MM-SE as a DBO candidate. Sample matrix (the matrix that describes the effects of the sample on the incident optical beam) obtained from MM-SE contains up to 16 elements. We show that the Mueller elements from the off-diagonal 2x2 blocks respond to overlay linearly and are zero when overlay errors are absent. This superior property enables empirical DBO (eDBO) using two pads per direction. Furthermore, the rich information in Mueller matrix and its direct response to overlay make it feasible to extract overlay errors from only one pad per direction using modeling approach (mDBO). We here present the Mueller overlay results using both eDBO and mDBO and compare the results with image-based overlay (IBO) and CD-SEM results. We also report the tool induced shifts (TIS) and dynamic repeatability.

  19. Engineering related neutron diffraction measurements probing strains, texture and microstructure

    Energy Technology Data Exchange (ETDEWEB)

    Clausen, Bjorn [Los Alamos National Laboratory; Brown, Donald W [Los Alamos National Laboratory; Tome, Carlos N [Los Alamos National Laboratory; Balogh, Levente [Los Alamos National Laboratory; Vogel, Sven C [Los Alamos National Laboratory

    2010-01-01

    Neutron diffraction has been used for engineering applications for nearly three decades. The basis of the technique is powder diffraction following Bragg's Law. From the measured diffraction patterns information about internal, or residual, strain can be deduced from the peak positions, texture information can be extracted from the peak intensities, and finally the peak widths can provide information about the microstructure, e.g. dislocation densities and grain sizes. The strains are measured directly from changes in lattice parameters, however, in many cases it is non-trivial to determine macroscopic values of stress or strain from the measured data. The effects of intergranular strains must be considered, and combining the neutron diffraction measurements with polycrystal deformation modeling has proven invaluable in determining the overall stress and strain values of interest in designing and dimensioning engineering components. Furthelmore, the combined use of measurements and modeling has provided a tool for elucidating basic material properties, such as critical resolved shear stresses for the active deformation modes and their evolution as a function of applied deformation.

  20. Digital diffraction analysis enables low-cost molecular diagnostics on a smartphone.

    Science.gov (United States)

    Im, Hyungsoon; Castro, Cesar M; Shao, Huilin; Liong, Monty; Song, Jun; Pathania, Divya; Fexon, Lioubov; Min, Changwook; Avila-Wallace, Maria; Zurkiya, Omar; Rho, Junsung; Magaoay, Brady; Tambouret, Rosemary H; Pivovarov, Misha; Weissleder, Ralph; Lee, Hakho

    2015-05-05

    The widespread distribution of smartphones, with their integrated sensors and communication capabilities, makes them an ideal platform for point-of-care (POC) diagnosis, especially in resource-limited settings. Molecular diagnostics, however, have been difficult to implement in smartphones. We herein report a diffraction-based approach that enables molecular and cellular diagnostics. The D3 (digital diffraction diagnosis) system uses microbeads to generate unique diffraction patterns which can be acquired by smartphones and processed by a remote server. We applied the D3 platform to screen for precancerous or cancerous cells in cervical specimens and to detect human papillomavirus (HPV) DNA. The D3 assay generated readouts within 45 min and showed excellent agreement with gold-standard pathology or HPV testing, respectively. This approach could have favorable global health applications where medical access is limited or when pathology bottlenecks challenge prompt diagnostic readouts.

  1. Diffraction limit of refractive compound lens

    International Nuclear Information System (INIS)

    Kolchevsky, N.N.; Petrov, P.V.

    2015-01-01

    A compound X-ray and neutron lenses is an array of lenses with a common axis. The resolution limited by aberration and by diffraction. Diffraction limit comes from theory based on absorption aperture of the compound refractive lenses. Beam passing through transparent lenses form Airy pattern. Results of calculation of diffraction resolution limit for non-transparent X-ray and neutron lenses are discussed. (authors)

  2. Quantification and differentiation of nuclear tracks in SSNTD by simulation of their diffraction pattern

    International Nuclear Information System (INIS)

    Palacios, D.; Palacios, F.; Vitoria, T.

    2001-01-01

    An alternative method to count and differentiate nuclear tracks in SSNTD is described. The method is based on the simulation and analysis of Fraunhofer diffraction pattern formed when coherent light passes through tracks of an etched detector. Transformation of the optical system was carried out by a digital procedure of Fourier Transform. Spectral analysis of the radial intensity distribution facilitated to quantify and differentiate tracks for its diameters. The formalism outlined is also applicable to elliptic tracks. Different components of the developed software (TRACKS) are shown. Results obtained by simulation and by the theoretical model gave satisfactory concordance. With the purpose of optimizing the proposed method, technical variants of optic microscopy are discussed. A model that considers the correction for track overlapping was developed and applied. Count error is small when track distribution changes in the field of view. The proposed method can differentiate genuine tracks from defects and anomalies of the detector. Analyzing the influence of illumination conditions and focus of the microscope on track counting and discrimination, the preliminary treatment of images obtained by the CCD camera was established. The proposed method allows, with low cost and operation simplicity, guaranteeing high speed in the obtaining of results, to calculate with good approximation track density in CR-39 detectors and to differentiate the energy of incident ions by track diameters with satisfactory accuracy and precision

  3. Development of Kossel micro-diffraction for strain and stress analysis at the micrometer scale: applications to crystalline materials

    International Nuclear Information System (INIS)

    Bouscaud, D.

    2012-01-01

    X-ray diffraction is a non-destructive method frequently used in materials science to analyse the stress state at a macroscopic scale. Due to the growing complexity of new materials and their applications, it is necessary to know the strain and stress state at a lower scale. Thus, a Kossel micro-diffraction experimental set-up was developed inside a scanning electron microscope. It allows to obtain the crystallographic orientation as well as the strains and stresses within a volume of a few cubic micrometers. Some experiments were also performed using a synchrotron radiation. An experimental procedure was developed to optimize the acquisition of Kossel line patterns and their post-processing. The stress calculation from Kossel patterns was validated by comparing the stress state of single crystals during in situ mechanical loading, obtained by Kossel micro-diffraction and with classical diffraction methods. Then Kossel micro-diffraction was applied to polycrystalline samples by gradually decreasing the grain size. Intergranular stress heterogeneities were for example measured in an interstitial-free steel. Experiments were finally carried out in thin layer samples representative of microelectronic components. (author)

  4. Nonlinear diffraction from a virtual beam

    DEFF Research Database (Denmark)

    Saltiel, Solomon M.; Neshev, Dragomir N.; Krolikowski, Wieslaw

    2010-01-01

    We observe experimentally a novel type of nonlinear diffraction in the process of two-wave mixing on a nonlinear quadratic grating.We demonstrate that when the nonlinear grating is illuminated simultaneously by two noncollinear beams, a second-harmonic diffraction pattern is generated by a virtual...... beam propagating along the bisector of the two pump beams. The observed iffraction phenomena is a purely nonlinear effect that has no analogue in linear diffraction...

  5. Angular criterion for distinguishing between Fraunhofer and Fresnel diffraction

    International Nuclear Information System (INIS)

    Medina, Francisco F.; Garcia-Sucerquia, Jorge; Castaneda, Roman; Matteucci, Giorgio

    2003-03-01

    The distinction between Fresnel and Fraunhofer diffraction is a crucial condition for the accurate analysis of diffracting structures. In this paper we propose a criterion based on the angle subtended by the first zero of the diffraction pattern from the center of the diffracting aperture. The determination of the zero of the diffraction pattern is the crucial point for assuring the precision of the criterion. It mainly depends on the dynamical range of the detector. Therefore, the applicability of adequate thresholds for different detector types is discussed. The criterion is also generalized by expressing it in terms of the number of Fresnel zones delimited by the aperture. Simulations are reported for illustrating the feasibility of the criterion. (author)

  6. A fully automatic peak-search program for the evaluation of Gauss-shaped diffraction patterns

    International Nuclear Information System (INIS)

    Lauterjung, J.; Will, G.; Hinze, E.

    1985-01-01

    Diffraction patterns (X-rays or neutrons) often contain regions of overlapping, unresolved peaks. When using energy-dispersive techniques with solid state detectors the degree of overlap is especially high because of the poor resolution of such detectors. Profile analysis then offers the possibility to overcome, or at least reduce this drawback. In this paper a peak-search program is represented for fully automatic separation of the individual peaks. Only the instrumental parameter fwhm (full width at half-maximum) and the recorded spectrum are required as input for the program. Results are given for orthorhombic MnSO 4 . (orig.)

  7. Diffraction enhanced kinetic depth X-ray imaging

    Science.gov (United States)

    Dicken, A.

    An increasing number of fields would benefit from a single analytical probe that can characterise bulk objects that vary in morphology and/or material composition. These fields include security screening, medicine and material science. In this study the X-ray region is shown to be an effective probe for the characterisation of materials. The most prominent analytical techniques that utilise X-radiation are reviewed. The study then focuses on methods of amalgamating the three dimensional power of kinetic depth X-ray (KDFX) imaging with the materials discrimination of angular dispersive X-ray diffraction (ADXRD), thus providing KDEX with a much needed material specific counterpart. A knowledge of the sample position is essential for the correct interpretation of diffraction signatures. Two different sensor geometries (i.e. circumferential and linear) that are able to collect end interpret multiple unknown material diffraction patterns and attribute them to their respective loci within an inspection volume are investigated. The circumferential and linear detector geometries are hypothesised, simulated and then tested in an experimental setting with the later demonstrating a greater ability at discerning between mixed diffraction patterns produced by differing materials. Factors known to confound the linear diffraction method such as sample thickness and radiation energy have been explored and quantified with a possible means of mitigation being identified (i.e. via increasing the sample to detector distance). A series of diffraction patterns (following the linear diffraction approach) were obtained from a single phantom object that was simultaneously interrogated via KDEX imaging. Areas containing diffraction signatures matched from a threat library have been highlighted in the KDEX imagery via colour encoding and match index is inferred by intensity. This union is the first example of its kind and is called diffraction enhanced KDEX imagery. Finally an additional

  8. Diffractive optical devices produced by light-assisted trapping of nanoparticles.

    Science.gov (United States)

    Muñoz-Martínez, J F; Jubera, M; Matarrubia, J; García-Cabañes, A; Agulló-López, F; Carrascosa, M

    2016-01-15

    One- and two-dimensional diffractive optical devices have been fabricated by light-assisted trapping and patterning of nanoparticles. The method is based on the dielectrophoretic forces appearing in the vicinity of a photovoltaic crystal, such as Fe:LiNbO3, during or after illumination. By illumination with the appropriate light distribution, the nanoparticles are organized along patterns designed at will. One- and two-dimensional diffractive components have been achieved on X- and Z-cut Fe:LiNbO3 crystals, with their polar axes parallel and perpendicular to the crystal surface, respectively. Diffraction gratings with periods down to around a few micrometers have been produced using metal (Al, Ag) nanoparticles with radii in the range of 70-100 nm. Moreover, several 2D devices, such as Fresnel zone plates, have been also produced showing the potential of the method. The diffractive particle patterns remain stable when light is removed. A method to transfer the diffractive patterns to other nonphotovoltaic substrates, such as silica glass, has been also reported.

  9. Quantitative EEG Applying the Statistical Recognition Pattern Method

    DEFF Research Database (Denmark)

    Engedal, Knut; Snaedal, Jon; Hoegh, Peter

    2015-01-01

    BACKGROUND/AIM: The aim of this study was to examine the discriminatory power of quantitative EEG (qEEG) applying the statistical pattern recognition (SPR) method to separate Alzheimer's disease (AD) patients from elderly individuals without dementia and from other dementia patients. METHODS...

  10. When fast atom diffraction turns 3D

    International Nuclear Information System (INIS)

    Zugarramurdi, Asier; Borisov, Andrei G.

    2013-01-01

    Fast atom diffraction at surfaces (FAD) in grazing incidence geometry is characterized by the slow motion in the direction perpendicular to the surface and fast motion parallel to the surface plane along a low index direction. It is established experimentally that for the typical surfaces the FAD reveals the 2D diffraction patterns associated with exchange of the reciprocal lattice vector perpendicular to the direction of fast motion. The reciprocal lattice vector exchange along the direction of fast motion is negligible. The usual approximation made in the description of the experimental data is then to assume that the effective potential leading to the diffraction results from the averaging of the 3D surface potential along the atomic strings forming the axial channel. In this work we use full quantum wave packet propagation calculations to study theoretically the possibility to observe the 3D diffraction in FAD experiments. We show that for the surfaces with large unit cell, such as can be the case for reconstructed or vicinal surfaces, the 3D diffraction can be observed. The reciprocal lattice vector exchange along the direction of fast motion leads to several Laue circles in the diffraction pattern

  11. Neutron-diffraction measurements of stress

    International Nuclear Information System (INIS)

    Holden, T.M.

    1995-01-01

    Experiments on bent steam-generator tubing have shown that different diffraction peaks, (1 1 1) or (0 0 2), give different results for the sign and magnitude of the stress and strain. From an engineering standpoint, the macroscopic stress field cannot be both positive and negative in the same volume, so this difference must be due to intergranular effects superposed on the macroscopic stress field. Uniaxial tensile test experiments with applied stresses beyond the 0.2% offset yield stress, help to understand this anomaly, by demonstrating the different strain response to applied stress along different crystallographic axes.When Zr-alloys are cooled from elevated temperatures, thermal stresses always develop, so that it is difficult to obtain a stress-free lattice spacing from which residual strains may be derived. From measurements of the temperature dependence of lattice spacing, the temperature at which the thermal stresses vanish may be found. From the lattice spacing at this temperature the stress-free lattice spacings at room temperature can be obtained readily.To interpret the measured strains in terms of macroscopic stress fields it is necessary to know the diffraction elastic constants. Neutron diffraction measurements of the diffraction elastic constants in a ferritic steel for the [1 1 0], [0 0 2] and [2 2 2] crystallographic axes, in directions parallel and perpendicular to the applied stress are compared with theoretical diffraction elastic constants. (orig.)

  12. Photonic crystal and photonic quasicrystal patterned in PDMS surfaces and their effect on LED radiation properties

    Energy Technology Data Exchange (ETDEWEB)

    Suslik, Lubos [Dept. of Physics, Faculty of Electrical Engineering, University of Zilina, Univerzitna 1, 010 26, Zilina (Slovakia); Pudis, Dusan, E-mail: pudis@fyzika.uniza.sk [Dept. of Physics, Faculty of Electrical Engineering, University of Zilina, Univerzitna 1, 010 26, Zilina (Slovakia); Goraus, Matej [Dept. of Physics, Faculty of Electrical Engineering, University of Zilina, Univerzitna 1, 010 26, Zilina (Slovakia); Nolte, Rainer [Fakultät für Maschinenbau FG Lichttechnik Ilmenau University of Technology, Ilmenau (Germany); Kovac, Jaroslav [Inst. of Electronics and Photonics, Slovak University of Technology, Ilkovicova 3, 812 19, Bratislava (Slovakia); Durisova, Jana; Gaso, Peter [Dept. of Physics, Faculty of Electrical Engineering, University of Zilina, Univerzitna 1, 010 26, Zilina (Slovakia); Hronec, Pavol [Inst. of Electronics and Photonics, Slovak University of Technology, Ilkovicova 3, 812 19, Bratislava (Slovakia); Schaaf, Peter [Chair Materials for Electronics, Institute of Materials Engineering and Institute of Micro- and Nanotechnologies MacroNano, TU Ilmenau, Gustav-Kirchhoff-Str. 5, 98693 Ilmenau (Germany)

    2017-02-15

    Graphical abstract: Photonic quasicrystal patterned in the surface of polydimethylsiloxane membrane (left) and radiation pattern of light emitting diode with patterned membrane applied in the surface (right). - Highlights: • We presented fabrication technique of PDMS membranes with patterned surface by photonic crystal (PhC) and photonic quasi-crystal (PQC). • Presented technique is effective for preparation PhC and PQC PDMS membranes easily implementing in the LED chip. • From the goniophotometer measurements, the membranes document effective angular emission due to the diffraction on patterned surfaces. • 12 fold symmetry PQC structure shows homogeneous radiation pattern, while the 2 fold symmetry of square PhC shows evident diffraction lobes. - Abstract: We present results of fabrication and implementation of thin polydimethylsiloxane (PDMS) membranes with patterned surface for the light emitting diode (LED). PDMS membranes were patterned by using the interference lithography in combination with embossing technique. Two-dimensional photonic crystal and photonic quasicrystal structures with different period were patterned in the surface of thin PDMS membranes with depth up to 550 nm. Patterned PDMS membranes placed on the LED chip effectively diffracted light and increased angular emission of LED radiation pattern. We presented effective technique for fabrication of patterned PDMS membranes, which could modify the emission properties of optoelectronic devices and can be applied directly on surface LEDs and small optical devices.

  13. the effect of the shape of atomic potential on the diffraction pattern of ...

    African Journals Online (AJOL)

    mansoor

    potential applications(Lifshitz, 2003). Ferralis et al. (2004) investigatethe diffraction from One- and two dimensional quasicrystalline gratings” using two different approaches (laser diffraction and calculated diffraction method using. Fibonacci series). The work suggested that, laser diffraction allows an inductive approach for.

  14. Diffraction-based BioCD biosensor for point-of-care diagnostics

    Science.gov (United States)

    Choi, H.; Chang, C.; Savran, C.; Nolte, D.

    2018-02-01

    The BioCD platform technology uses spinning-disk interferometry to detect molecular binding to target molecular probes in biological samples. Interferometric configurations have included differential phase contrast and in-line quadrature detection. For the detection of extremely low analyte concentrations, nano- or microparticles can enhance the signal through background-free diffraction detection. Diffraction signal measurements on BioCD biosensors are achieved by forming gratings on a disc surface. The grating pattern was printed with biotinylated bovine serum albumin (BSA) and streptavidin coated beads were deployed. The diameter of the beads was 1 micron and strong protein bonding occurs between BSA and streptavidin-coated beads at the printed location. The wavelength for the protein binding detection was 635 nm. The periodic pattern on the disc amplified scattered light into the first-order diffraction position. The diffracted signal contains Mie scattering and a randomly-distributed-bead noise contributions. Variation of the grating pattern periodicity modulates the diffraction efficiency. To test multiple spatial frequencies within a single scan, we designed a fan-shaped grating to perform frequency filter multiplexing on a diffraction-based BioCD.

  15. Diffractive production off nuclei-shadow of hadronic bremsstrahlung

    International Nuclear Information System (INIS)

    Bialas, A.; Czyz, W.

    1974-01-01

    Diffractive production on nuclei is calculated using as an input a specific model for diffractive production on nucleons. In this model diffractive production is described as a shadow of non-diffractive multiple production of particles. The mechanism for non-diffractive production is taken to be hadronic bremsstrahlung of independently produced clusters. It is shown that such a model naturally explains the strikingly simple pattern of absorption observed in coherent production on nuclei. Possible generalizations of these results are indicated. (author)

  16. Complex (Nonstandard) Six-Layer Polytypes of Lizardite Revealed from Oblique-Texture Electron Diffraction Patterns

    International Nuclear Information System (INIS)

    Zhukhlistov, A.P.; Zinchuk, N.N.; Kotel'nikov, D.D.

    2004-01-01

    Association of simple (1T and 3R) and two complex (nonstandard) orthogonal polytypes of the serpentine mineral lizardite from the Catoca kimberlite pipe (West Africa) association is revealed from oblique-texture electron diffraction patterns. A six-layer polytype with an ordered superposition of equally oriented layers (notation 3 2 3 2 3 4 3 4 3 6 3 6 or ++ - -00) belonging to the structural group A and a three-layer (336 or I,I,II) or a six-layer (336366 or I,I,II,I,II,II) polytype with alternating oppositely oriented layers and semi-disordered structure are identified using polytype analysis

  17. Pattern formation without diffraction matching in optical parametric oscillators with a metamaterial.

    Science.gov (United States)

    Tassin, Philippe; Van der Sande, Guy; Veretennicoff, Irina; Kockaert, Pascal; Tlidi, Mustapha

    2009-05-25

    We consider a degenerate optical parametric oscillator containing a left-handed material. We show that the inclusion of a left-handed material layer allows for controlling the strength and sign of the diffraction coefficient at either the pump or the signal frequency. Subsequently, we demonstrate the existence of stable dissipative structures without diffraction matching, i.e., without the usual relationship between the diffraction coefficients of the signal and pump fields. Finally, we investigate the size scaling of these light structures with decreasing diffraction strength.

  18. A new approach of quantum mechanics for neutron single-slit diffraction

    International Nuclear Information System (INIS)

    Wu Xiangyao; Yang Jinghai; Liu Xiaojing; Wang Li; Liu Bing; Fan Xihui; Guo Yiqing

    2007-01-01

    Phenomena of electron, neutron, atomic and molecular diffraction have been studied in many experiments, and these experiments are explained by many theoretical works. We study neutron single-slit diffraction with a quantum mechanical approach. It is found that the obvious diffraction patterns can be obtained when the single slit width a is in the range of 3λ-60λ. We also find a new quantum effect of the thickness of single-slit which can make a large impact on the diffraction pattern. The new quantum effect predicted in our work can be tested by the neutron single-slit diffraction experiment. (authors)

  19. Median Hetero-Associative Memories Applied to the Categorization of True-Color Patterns

    Science.gov (United States)

    Vázquez, Roberto A.; Sossa, Humberto

    Median associative memories (MED-AMs) are a special type of associative memory based on the median operator. This type of associative model has been applied to the restoration of gray scale images and provides better performance than other models, such as morphological associative memories, when the patterns are altered with mixed noise. Despite of his power, MED-AMs have not been applied in problems involving true-color patterns. In this paper we describe how a median hetero-associative memory (MED-HAM) could be applied in problems that involve true-color patterns. A complete study of the behavior of this associative model in the restoration of true-color images is performed using a benchmark of 14400 images altered by different type of noises. Furthermore, we describe how this model can be applied to an image categorization problem.

  20. The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements

    Energy Technology Data Exchange (ETDEWEB)

    Tong, Vivian, E-mail: v.tong13@imperial.ac.uk [Department of Materials, Imperial College London, Prince Consort Road, London SW7 2AZ (United Kingdom); Jiang, Jun [Department of Materials, Imperial College London, Prince Consort Road, London SW7 2AZ (United Kingdom); Wilkinson, Angus J. [Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH (United Kingdom); Britton, T. Ben [Department of Materials, Imperial College London, Prince Consort Road, London SW7 2AZ (United Kingdom)

    2015-08-15

    High resolution, cross-correlation-based, electron backscatter diffraction (EBSD) measures the variation of elastic strains and lattice rotations from a reference state. Regions near grain boundaries are often of interest but overlap of patterns from the two grains could reduce accuracy of the cross-correlation analysis. To explore this concern, patterns from the interior of two grains have been mixed to simulate the interaction volume crossing a grain boundary so that the effect on the accuracy of the cross correlation results can be tested. It was found that the accuracy of HR-EBSD strain measurements performed in a FEG-SEM on zirconium remains good until the incident beam is less than 18 nm from a grain boundary. A simulated microstructure was used to measure how often pattern overlap occurs at any given EBSD step size, and a simple relation was found linking the probability of overlap with step size. - Highlights: • Pattern overlap occurs at grain boundaries and reduces HR-EBSD accuracy. • A test is devised to measure the accuracy of HR-EBSD in the presence of overlap. • High pass filters can sometimes, but not generally, improve HR-EBSD measurements. • Accuracy of HR-EBSD remains high until the reference pattern intensity is <72%. • 9% of points near a grain boundary will have significant error for 200nm step size in Zircaloy-4.

  1. X-ray diffraction identification of clay minerals by microcomputer

    International Nuclear Information System (INIS)

    Rodrigues, S.; Imasava, F.J.

    1988-01-01

    The identification of clay minerals by X-ray powder diffraction are done by searching an unknown pattern with a file of standard X-ray diffraction patterns. For this searching done by hand is necessary a long time. This paper shows a program in ''Basic'' language to be utilized in microcomputers for the math of the unknown pattern, using the high velocity of comparison of the microcomputer. A few minutes are used for the match. (author) [pt

  2. rf streak camera based ultrafast relativistic electron diffraction.

    Science.gov (United States)

    Musumeci, P; Moody, J T; Scoby, C M; Gutierrez, M S; Tran, T

    2009-01-01

    We theoretically and experimentally investigate the possibility of using a rf streak camera to time resolve in a single shot structural changes at the sub-100 fs time scale via relativistic electron diffraction. We experimentally tested this novel concept at the UCLA Pegasus rf photoinjector. Time-resolved diffraction patterns from thin Al foil are recorded. Averaging over 50 shots is required in order to get statistics sufficient to uncover a variation in time of the diffraction patterns. In the absence of an external pump laser, this is explained as due to the energy chirp on the beam out of the electron gun. With further improvements to the electron source, rf streak camera based ultrafast electron diffraction has the potential to yield truly single shot measurements of ultrafast processes.

  3. Blazed Grating Resonance Conditions and Diffraction Efficiency Optical Transfer Function

    KAUST Repository

    Stegenburgs, Edgars

    2017-01-08

    We introduce a general approach to study diffraction harmonics or resonances and resonance conditions for blazed reflecting gratings providing knowledge of fundamental diffraction pattern and qualitative understanding of predicting parameters for the most efficient diffraction.

  4. Blazed Grating Resonance Conditions and Diffraction Efficiency Optical Transfer Function

    KAUST Repository

    Stegenburgs, Edgars; Alias, Mohd Sharizal B.; Ng, Tien Khee; Ooi, Boon S.

    2017-01-01

    We introduce a general approach to study diffraction harmonics or resonances and resonance conditions for blazed reflecting gratings providing knowledge of fundamental diffraction pattern and qualitative understanding of predicting parameters for the most efficient diffraction.

  5. Reaching (sub-)micrometer resolution of photo-immobilized proteins using diffracted light beams

    DEFF Research Database (Denmark)

    Skovsen, Esben; Neves Petersen, Teresa; Petersen, Steffen B.

    2008-01-01

    , with dimensions as small as a few micrometers. The ultimate size of the immobilized spots is dependent on the focal area of the UV beam. The technology involves light induced formation of free, reactive thiol groups in molecules containing aromatic residues nearby disulphide bridges. It is not only limited...... to immobilizing molecules according to conventional patterns like microarrays, as any bitmap motif can virtually be used a template for patterning. We now show that molecules (proteins) can be immobilized on a surface with any arbitrary pattern according to diffraction patterns of light. The pattern of photo......-immobilized proteins reproduces the diffraction pattern of light expected with the optical setup. Immobilising biomolecules according to diffraction patterns of light will allow achievement of smaller patterns with higher resolution. The flexibility of this new technology leads to any patterns of photo...

  6. Atomic resolution three-dimensional electron diffraction microscopy

    International Nuclear Information System (INIS)

    Miao Jianwei; Ohsuna, Tetsu; Terasaki, Osamu; Hodgson, Keith O.; O'Keefe, Michael A.

    2002-01-01

    We report the development of a novel form of diffraction-based 3D microscopy to overcome resolution barriers inherent in high-resolution electron microscopy and tomography. By combining coherent electron diffraction with the oversampling phasing method, we show that the 3D structure of a nanocrystal can be determined ab initio at a resolution of 1 Angstrom from 29 simulated noisy diffraction patterns. This new form of microscopy can be used to image the 3D structures of nanocrystals and noncrystalline samples, with resolution limited only by the quality of sample diffraction

  7. Automatic control unit for A neutron diffraction crystal spectrometer

    Energy Technology Data Exchange (ETDEWEB)

    Adib, M.; Abbas, Y.; Mostafa, M.; Hamouda, I.

    1982-01-01

    An automatic transistorized unit has been designed and constructed to control the operation of the double axis crystal spectrometer installed in front of one of the horizontal channels of the ET-RR-1 reactor. The function of the automatic unit is to store the diffracted neutrons at a certain angle with respect to the direction of the incident neutron beam in a selected channel of a 1024-multichannel analyzer for a certain preadjusted time period. AT the end of this time period the unit rotates the spectrometer's arm to another angle, selects the next channel of the MCA and provides the measurement of the diffracted neutron for the same time period. Such a sequence is repeated automatically over all angles required for the neutron diffraction pattern of the sample under investigation. As a result, the stored information at the MCA provides the neutron diffraction pattern as a function of channel number, where each channel corresponds to a certain scattering angle. The stored distribution at MCA can be obtained through the analyzer read out unit. The designed automatic unit has the possibility of providing the neutron diffraction pattern using a 6-digit scaler and a printer.

  8. Development and application of Darwin X-ray diffraction theory for structure and chemical composition determination in multilayered crystals

    International Nuclear Information System (INIS)

    Wojcik, M.; Gaca, J.; Turos, A.; Strupinski, W.

    2000-01-01

    The method of investigation of the chemical composition for quaternary heterostructures has been developed. To this end X-ray high resolution diffractometry and RBS methods were applied. This method consists in finding a best fit between experimental diffraction pattern and theoretical one calculated, employing Darwin dynamical diffraction theory for a given model of heterostructure. This procedure was applied to determine the chemical profile in the growth direction for InGaAsP/InP superlattices that were grown by MOCVD technology on 001 InP substrate. The relations between the chemical composition of In x Ga 1-x As y P 1-y layer, its lattice parameter, optoelectronic properties and growth conditions were found. (author)

  9. Accurate Charge Densities from Powder Diffraction

    DEFF Research Database (Denmark)

    Bindzus, Niels; Wahlberg, Nanna; Becker, Jacob

    Synchrotron powder X-ray diffraction has in recent years advanced to a level, where it has become realistic to probe extremely subtle electronic features. Compared to single-crystal diffraction, it may be superior for simple, high-symmetry crystals owing to negligible extinction effects and minimal...... peak overlap. Additionally, it offers the opportunity for collecting data on a single scale. For charge densities studies, the critical task is to recover accurate and bias-free structure factors from the diffraction pattern. This is the focal point of the present study, scrutinizing the performance...

  10. Classification of glutinous rice (Oryza sativa L.) starches based on X-ray diffraction pattern

    Energy Technology Data Exchange (ETDEWEB)

    Zhang, Q.; Abe, T.; Ando, H.; Sasahara, T.

    1993-07-01

    This study was carried out to analyse the cultivar variability of the X-ray diffraction pattern of glutinous rice starches. Four peaks in the X-ray diffractograms were identified, i.e. 3b, 4a, 4b and 6a. The four peaks were measured from the base line for 71 cultivars and three M{sub 3} lines which were irradiated by γ-rays at the rates of 10, 20 and 30 kr, respectively. Glutinous rice starches were classified into two types by discriminant analysis based on the values of 3b/4b, 4a/4b and 6a/4b. The X-ray diffraction type of the three cultivars did not change with the cultivation areas of different latitude, while that of eleven cultivars varied. Degree of crystallinity was estimated using the formula, (I{sub max} — I{sub i})/I{sub max} where I{sub max} is the maximum height from background intensity line among cultivars, and I{sub i} represents the four peaks. These ratios indicated that the changes in the order of crystallinity were similar to those with the water content and/or hydration and temperature for gelatinization among and/or within cultivars. (author)

  11. X-ray diffraction from thin films : Size/strain analysis and whole pattern fitting

    Energy Technology Data Exchange (ETDEWEB)

    Scardi, P [Trento Univ. (Italy). Dept. of Materials Engineering

    1996-09-01

    Line Profile Analysis (LPA) and whole pattern fitting may be used with success for the characterization of thin films from XRD data collected with the traditional Bragg-Brentano geometry. The size/strain analysis was conducted by an integrated procedure of profile modelling-assisted Fourier analysis, in order to measure the content of lattice imperfections and crystalline domain size along the growth direction in heteroepitaxial thin films. The microstructure of these films is typical of several PVD processes for the production of highly textured and low-defect thin crystalline layers. The same analysis could be conducted on random thin films as well, and in this case it is possible to determine an average crystallite size and shape. As will be shown in the paper, structural and microstructural parameters obtained by these methods may be correlated with thin film properties of technological interest. The whole pattern analysis may be used to obtain the information contained in a wide region of the diffraction pattern. This approach, currently used for the quantitative analysis of phase mixtures in traditional powder samples, was modified to account both for the size/strain effects, according to a simplified LPA, and for the structure of thin films and multi-layer systems. In this way, a detailed analysis based on a structural model for the present phases can be performed considering the real geometry of these samples. In particular, the quantitative phase analysis could be conducted in terms of layer thickness instead of volume or weight fractions.

  12. X-ray diffraction from thin films : Size/strain analysis and whole pattern fitting

    International Nuclear Information System (INIS)

    Scardi, P.

    1996-01-01

    Line Profile Analysis (LPA) and whole pattern fitting may be used with success for the characterization of thin films from XRD data collected with the traditional Bragg-Brentano geometry. The size/strain analysis was conducted by an integrated procedure of profile modelling-assisted Fourier analysis, in order to measure the content of lattice imperfections and crystalline domain size along the growth direction in heteroepitaxial thin films. The microstructure of these films is typical of several PVD processes for the production of highly textured and low-defect thin crystalline layers. The same analysis could be conducted on random thin films as well, and in this case it is possible to determine an average crystallite size and shape. As will be shown in the paper, structural and microstructural parameters obtained by these methods may be correlated with thin film properties of technological interest. The whole pattern analysis may be used to obtain the information contained in a wide region of the diffraction pattern. This approach, currently used for the quantitative analysis of phase mixtures in traditional powder samples, was modified to account both for the size/strain effects, according to a simplified LPA, and for the structure of thin films and multi-layer systems. In this way, a detailed analysis based on a structural model for the present phases can be performed considering the real geometry of these samples. In particular, the quantitative phase analysis could be conducted in terms of layer thickness instead of volume or weight fractions

  13. Analysis of XFEL serial diffraction data from individual crystalline fibrils

    Directory of Open Access Journals (Sweden)

    David H. Wojtas

    2017-11-01

    Full Text Available Serial diffraction data collected at the Linac Coherent Light Source from crystalline amyloid fibrils delivered in a liquid jet show that the fibrils are well oriented in the jet. At low fibril concentrations, diffraction patterns are recorded from single fibrils; these patterns are weak and contain only a few reflections. Methods are developed for determining the orientation of patterns in reciprocal space and merging them in three dimensions. This allows the individual structure amplitudes to be calculated, thus overcoming the limitations of orientation and cylindrical averaging in conventional fibre diffraction analysis. The advantages of this technique should allow structural studies of fibrous systems in biology that are inaccessible using existing techniques.

  14. Submicron resolution X-ray diffraction from periodically patterned GaAs nanorods grown onto Ge[111

    Energy Technology Data Exchange (ETDEWEB)

    Davydok, Anton; Biermanns, Andreas; Pietsch, Ullrich [Solid State Physics, Siegen University (Germany); Grenzer, Joerg [FZ-Dresden Rossendorf, Dresden (Germany); Paetzelt, Hendrik; Gottschalch, Volker; Bauer, Jens [Solid State Chemistry, University of Leipzig (Germany)

    2009-08-15

    We present high-resolution X-ray diffraction pattern of periodic GaAs nanorods (NRs) ensembles and individual GaAs NRs grown catalyst-free throughout a pre-patterned amorphous SiN{sub x} mask onto Ge[111]B surfaces by selective-area MOVPE method. To the best of our knowledge this is the first report about nano-structure X-ray characterization growth on non-polar substrate. The experiment has been performed at home laboratory and using synchrotron radiation using a micro-sized beam prepared by compound refractive lenses. Due to the non-polar character of the substrate the shapes of NRs appear not uniform and vary between deformed hexagonal and trigonal in symmetry. Because the average diameter of NRs equals the experimental resolution certain cuts through slightly inclined edges or corners of individual NRs with lateral size of about 225 nm could be selected using spatially resolved reciprocal space mapping. (Abstract Copyright [2009], Wiley Periodicals, Inc.)

  15. Fundamental parameters approach applied to focal construct geometry for X-ray diffraction

    International Nuclear Information System (INIS)

    Rogers, K.; Evans, P.; Prokopiou, D.; Dicken, A.; Godber, S.; Rogers, J.

    2012-01-01

    A novel geometry for the acquisition of powder X-ray diffraction data, referred to as focal construct geometry (FCG), is presented. Diffraction data obtained by FCG have been shown to possess significantly enhanced intensity due to the hollow tube beam arrangement utilized. In contrast to conventional diffraction, the detector is translated to collect images along a primary axis and record the location of Bragg maxima. These high intensity condensation foci are unique to FCG and appear due to the convergence of Debye cones at single points on the primary axis. This work focuses on a two dimensional, fundamental parameter's approach to simulate experimental data and subsequently aid with interpretation. This convolution method is shown to favorably reproduce the experimental diffractograms and can also accommodate preferred orientation effects in some circumstances.

  16. Diffraction analysis of the microstructure of materials

    CERN Document Server

    Scardi, Paolo

    2004-01-01

    Diffraction Analysis of the Microstructure of Materials provides an overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.

  17. Time-resolved diffraction studies of muscle using synchrotron radiation

    International Nuclear Information System (INIS)

    Harford, Jeffrey; Squire, John

    1997-01-01

    Muscle contraction is one of those biological phenomena that we can all appreciate in our everyday lives. Sometimes it is when we are resting quietly and are aware of our heartbeat. At other times it may be when we are exerting ourselves and become short of breath, or when we exercise for a long period and our muscles start to ache. The way in which muscles produce force has exercised the minds of philosophers and scientists at least since the days of Erasistratus in the third century BC. Nowadays, of course, we know a very great deal about muscle structure, physiology and biochemistry, but we still do not know exactly what the molecular process is that produces movement. An ideal way of probing this process would be to be able to obtain signals from the relevant molecules as they actually go through their normal force-generating routine in an active muscle. The spatial dimensions involved are in the region of 1-50 nm, thus precluding the use of light microscopy, and the time regime is microseconds to milliseconds. Techniques with the appropriate spatial resolution might be electron microscopy and x-ray diffraction, but electron microscopy cannot yet be carried out on living tissue. X-ray diffraction methods can clearly have the right sort of spatial resolution, but what about recording diffraction patterns in the very short times involved (say 1 ms)? It is here that the high flux from synchrotron storage rings comes into its own. Using synchrotron radiation from, say, the SRS at the CCLRC Daresbury Laboratory it is possible to record x-ray diffraction patterns from living muscles in the millisecond time regime and to follow how these diffraction patterns change as the muscles go through typical contraction cycles. Unfortunately, x-ray diffraction is not a direct imaging method; the observed distribution of diffracted intensity needs to be interpreted in some way to give useful information on the spatial relationships of the force-generating molecules. This review

  18. High throughput screening of ligand binding to macromolecules using high resolution powder diffraction

    Science.gov (United States)

    Von Dreele, Robert B.; D'Amico, Kevin

    2006-10-31

    A process is provided for the high throughput screening of binding of ligands to macromolecules using high resolution powder diffraction data including producing a first sample slurry of a selected polycrystalline macromolecule material and a solvent, producing a second sample slurry of a selected polycrystalline macromolecule material, one or more ligands and the solvent, obtaining a high resolution powder diffraction pattern on each of said first sample slurry and the second sample slurry, and, comparing the high resolution powder diffraction pattern of the first sample slurry and the high resolution powder diffraction pattern of the second sample slurry whereby a difference in the high resolution powder diffraction patterns of the first sample slurry and the second sample slurry provides a positive indication for the formation of a complex between the selected polycrystalline macromolecule material and at least one of the one or more ligands.

  19. Duality in diffraction dissociations

    International Nuclear Information System (INIS)

    Santoro, Alberto.

    1977-01-01

    Diffractive dissociations (aN→a*πN) are naturally explained and a model that accounts for the three-variable correlation (mass-transfer-Jackson angle correlation) is presented. This model takes into account the three possible exchanges: t (pion), u(a*) and s(a) channel exchanger. The physical consequences of the model are: a strong mass-slope correlation due to the zeros of the amplitude, a factorization of diffractive dissociations (factorization of the Pomeron), the possibility of extending this model to double diffractive dissociation and diffraction by nuclei. This model was applied to the NN→NπN reaction. Using the usual parameters of the Deck model, a comparison is made with experiments for all available distributions. the strong slope of the peak at 1400 MeV is naturally explained [fr

  20. Determination of patterns of interplanar distances starting from crystalline parameters for the Cyber computer of the ININ

    International Nuclear Information System (INIS)

    Macias B, L.R.

    1991-03-01

    In this report a program in Fortran language that reproduces the pattern of the Joint Committee on Powder Diffraction Standards is presented and that it can be applied to identify non well-known samples such as in those that only by means of articles or other sources the values of the parameters of the elementary cell are lightly known and by this way the correspondent diffraction pattern can be accurately generated. (Author)

  1. Crystallized solids characterization by X-ray diffraction

    International Nuclear Information System (INIS)

    Broll, N.

    1996-01-01

    This work deals with the crystallized solids characterization by X-ray diffraction. The powders diffraction principle is described. Then are given the different powders diffraction experimental methods. An X-ray diffraction device is essentially constituted of three parts: the X-rays source, the sample and the detector. The source is usually constituted by an X-rays tube whereas the sample can be fixed on a photographic chamber or put on a goniometer. The different photographic chambers which can be used (Debye-Scherrer, Seeman-Bohlin and Guinier) are described. The powders diffractometer the most used is a Bragg-Brentano focusing diffractometer because it allows to obtain very sharp spectral lines and an important diffracted intensity. The detectors which are the mainly used are the scintillation counters. The most important use in powders diffractometry is the identification of the different phases of a sample. The phases identification consists to compare the unknown sample spectrum at those of standard materials indexed until now. Two methods exist at present. They are explained and their limits in the phases search are given. Another use of the X-ray diffraction is the quantitative analysis. It consists to determine the concentrations of each crystal phases of a sample. The principles of these quantitative methods are given. The lattice parameters of a polycrystal material can be determined from its X-ray pattern too with a very high precision. The way to index powders patterns is given. The residual stresses of materials can also be estimated. The principle of this measured method is explained. It is at last possible to study from an X-ray pattern, the material grain orientations during the different steps of preparation and working. (O.M.). 13 refs., 19 figs., 1 tab

  2. Femtosecond X-ray diffraction from two-dimensional protein crystals

    Directory of Open Access Journals (Sweden)

    Matthias Frank

    2014-03-01

    Full Text Available X-ray diffraction patterns from two-dimensional (2-D protein crystals obtained using femtosecond X-ray pulses from an X-ray free-electron laser (XFEL are presented. To date, it has not been possible to acquire transmission X-ray diffraction patterns from individual 2-D protein crystals due to radiation damage. However, the intense and ultrafast pulses generated by an XFEL permit a new method of collecting diffraction data before the sample is destroyed. Utilizing a diffract-before-destroy approach at the Linac Coherent Light Source, Bragg diffraction was acquired to better than 8.5 Å resolution for two different 2-D protein crystal samples each less than 10 nm thick and maintained at room temperature. These proof-of-principle results show promise for structural analysis of both soluble and membrane proteins arranged as 2-D crystals without requiring cryogenic conditions or the formation of three-dimensional crystals.

  3. NIST/Sandia/ICDD Electron Diffraction Database: A Database for Phase Identification by Electron Diffraction.

    Science.gov (United States)

    Carr, M J; Chambers, W F; Melgaard, D; Himes, V L; Stalick, J K; Mighell, A D

    1989-01-01

    A new database containing crystallographic and chemical information designed especially for application to electron diffraction search/match and related problems has been developed. The new database was derived from two well-established x-ray diffraction databases, the JCPDS Powder Diffraction File and NBS CRYSTAL DATA, and incorporates 2 years of experience with an earlier version. It contains 71,142 entries, with space group and unit cell data for 59,612 of those. Unit cell and space group information were used, where available, to calculate patterns consisting of all allowed reflections with d -spacings greater than 0.8 A for ~ 59,000 of the entries. Calculated patterns are used in the database in preference to experimental x-ray data when both are available, since experimental x-ray data sometimes omits high d -spacing data which falls at low diffraction angles. Intensity data are not given when calculated spacings are used. A search scheme using chemistry and r -spacing (reciprocal d -spacing) has been developed. Other potentially searchable data in this new database include space group, Pearson symbol, unit cell edge lengths, reduced cell edge length, and reduced cell volume. Compound and/or mineral names, formulas, and journal references are included in the output, as well as pointers to corresponding entries in NBS CRYSTAL DATA and the Powder Diffraction File where more complete information may be obtained. Atom positions are not given. Rudimentary search software has been written to implement a chemistry and r -spacing bit map search. With typical data, a full search through ~ 71,000 compounds takes 10~20 seconds on a PDP 11/23-RL02 system.

  4. Holographic Reconstruction of Photoelectron Diffraction and Its Circular Dichroism for Local Structure Probing

    Science.gov (United States)

    Matsui, Fumihiko; Matsushita, Tomohiro; Daimon, Hiroshi

    2018-06-01

    The local atomic structure around a specific element atom can be recorded as a photoelectron diffraction pattern. Forward focusing peaks and diffraction rings around them indicate the directions and distances from the photoelectron emitting atom to the surrounding atoms. The state-of-the-art holography reconstruction algorithm enables us to image the local atomic arrangement around the excited atom in a real space. By using circularly polarized light as an excitation source, the angular momentum transfer from the light to the photoelectron induces parallax shifts in these diffraction patterns. As a result, stereographic images of atomic arrangements are obtained. These diffraction patterns can be used as atomic-site-resolved probes for local electronic structure investigation in combination with spectroscopy techniques. Direct three-dimensional atomic structure visualization and site-specific electronic property analysis methods are reviewed. Furthermore, circular dichroism was also found in valence photoelectron and Auger electron diffraction patterns. The investigation of these new phenomena provides hints for the development of new techniques for local structure probing.

  5. A review and reassessment of diffraction, scattering, and shadows in electrodynamics

    Science.gov (United States)

    Berg, Matthew J.; Sorensen, Christopher M.

    2018-05-01

    The concepts of diffraction and scattering are well known and considered fundamental in optics and other wave phenomena. For any type of wave, one way to define diffraction is the spreading of waves, i.e., no change in the average propagation direction, while scattering is the deflection of waves with a clear change of propagation direction. However, the terms "diffraction" and "scattering" are often used interchangeably, and hence, a clear distinction between the two is difficult to find. This review considers electromagnetic waves and retains the simple definition that diffraction is the spreading of waves but demonstrates that all diffraction patterns are the result of scattering. It is shown that for electromagnetic waves, the "diffracted" wave from an object is the Ewald-Oseen extinction wave in the far-field zone. The intensity distribution of this wave yields what is commonly called the diffraction pattern. Moreover, this is the same Ewald-Oseen wave that cancels the incident wave inside the object and thereafter continues to do so immediately behind the object to create a shadow. If the object is much wider than the beam but has a hole, e.g., a screen with an aperture, the Ewald-Oseen extinction wave creates the shadow behind the screen and the incident light that passes through the aperture creates the diffraction pattern. This point of view also illustrates Babinet's principle. Thus, it is the Ewald-Oseen extinction theorem that binds together diffraction, scattering, and shadows.

  6. Diffraction enhanced x-ray imaging

    International Nuclear Information System (INIS)

    Thomlinson, W.; Zhong, Z.; Johnston, R.E.; Sayers, D.

    1997-09-01

    Diffraction enhanced imaging (DEI) is a new x-ray radiographic imaging modality using synchrotron x-rays which produces images of thick absorbing objects that are almost completely free of scatter. They show dramatically improved contrast over standard imaging applied to the same phantoms. The contrast is based not only on attenuation but also the refraction and diffraction properties of the sample. The diffraction component and the apparent absorption component (absorption plus extinction contrast) can each be determined independently. This imaging method may improve the image quality for medical applications such as mammography

  7. Multi-order nonlinear diffraction in second harmonic generation

    DEFF Research Database (Denmark)

    Saltiel, S. M.; Neshev, D.; Krolikowski, Wieslaw

    We analyze the emission patterns in the process of second harmonic (SH) generation in χ(2) nonlinear gratings and identify for the first time, to the best of our knowledge, the evidence of Raman-Nath type nonlinear diffraction in frequency doubling processes.......We analyze the emission patterns in the process of second harmonic (SH) generation in χ(2) nonlinear gratings and identify for the first time, to the best of our knowledge, the evidence of Raman-Nath type nonlinear diffraction in frequency doubling processes....

  8. Interpretation of the shape of electron diffraction spots from small polyhedral crystals by means of the crystal shape amplitude

    International Nuclear Information System (INIS)

    Neumann, W.; Hofmeister, H.; Heydenreich, J.; Komrska, J.

    1988-01-01

    The influence of the crystal shape on the fine structure of transmission electron diffraction (TED) patterns described by the crystal shape amplitude is discussed. A general algebraic expression for the crystal shape amplitude of any crystal polyhedron is used for computing the intensity distribution of TED reflections. The computer simulation method is applied to the analysis of the fine structure of TED patterns of small gold and palladium crystals having octahedral and tetrahedral habits. (orig.)

  9. International Centre for Diffraction Data (ICDD)

    International Nuclear Information System (INIS)

    Hubbard, C.R.; O'Connor, B.H.

    2002-01-01

    Full text: The ICDD is a not-for-profit organisation comprising approximately 300 of the world's leading x-ray scientists. It is dedicated to collecting, editing, publishing and distributing powder diffraction data for the identification of crystalline materials. The membership of the ICDD consists of worldwide representation from academe, government and industry. It is our mission to continue as the world centre for quality x-ray powder diffraction data to meet the needs of the technical community. Through the combined efforts of the members and its staff of 40 at ICDD Headquarters, the organisation serves the x-ray analysis community (i) by producing the ICDD Powder Diffraction File (PDF) and other data base products for materials characterisation; (ii) through x-ray analysis education programs and conference management (including the Denver X-ray Conference); and (iii) through philanthropic initiatives such as scholarship support for postgraduate students working in the field. The current Release 2001 of the PDF (PDF-2) contains 87,500 measured patterns and 49,000 patterns calculated from the ICSD database. The number of PDF patterns in this latest release has increased by approximately 3,000, including some 2,500 measured patterns. The quality of the database is being continuously improved through the organisation's Grant-in-Aid program whereby diffractionists around the world contribute to the measurement of patterns for new materials and to the improvement of existing PDF data. The organisation is devoting much attention to the needs of the bioscience community. The database will soon feature a much-expanded set of patterns for organic, polymer, pharmaceutical and biomaterials. The ICDD is about to release a relational database (RDB) version of the PDF (PDF-4) which will give users a very sophisticated tool for data mining. The PDF-4 will provide a quantum leap in data mining techniques, and will soon lead to the PDF being cross-linked to other diffraction

  10. Diffraction from the perspective of the spatial coherence wavelets

    International Nuclear Information System (INIS)

    Castaneda, R.; Carrasquilla-Alvarez, J.; Garcia-Sucerquia, J.

    2005-10-01

    The diffraction of spatially partially coherent optical fields is analysed by using two concepts recently introduced by the authors: the spatial coherence wavelets and the effective diffracting aperture. Within this framework, the intimate link between the spatial properties of the optical field and the aperture's edges in the diffraction phenomena is studied. New insight is proposed in regard to the diffraction in the Fresnel - Fraunhofer approximation. Our ideas are supported by numerical calculations and analysis of the diffraction patterns obtained when an optical field with adjustable spatial coherence impinges upon a circular aperture (author)

  11. Quantum diffraction and interference of spatially correlated photon pairs and its Fourier-optical analysis

    International Nuclear Information System (INIS)

    Shimizu, Ryosuke; Edamatsu, Keiichi; Itoh, Tadashi

    2006-01-01

    We present one- and two-photon diffraction and interference experiments involving parametric down-converted photon pairs. By controlling the divergence of the pump beam in parametric down-conversion, the diffraction-interference pattern produced by an object changes from a quantum (perfectly correlated) case to a classical (uncorrelated) one. The observed diffraction and interference patterns are accurately reproduced by Fourier-optical analysis taking into account the quantum spatial correlation. We show that the relation between the spatial correlation and the object size plays a crucial role in the formation of both one- and two-photon diffraction-interference patterns

  12. An automatic control unit for A neutron diffraction crystal spectrometer

    International Nuclear Information System (INIS)

    Adib, M.; Abbas, Y.; Mostafa, M.; Hamouda, I.

    1982-01-01

    An automatic transistorized unit has been designed and constructed to control the operation of the double axis crystal spectrometer installed in front of one of the horizontal channels of the ET-RR-1 reactor. The function of the automatic unit is to store the diffracted neutrons at a certain angle with respect to the direction of the incident neutron beam in a selected channel of a 1024-multichannel analyzer for a certain preadjusted time period. AT the end of this time period the unit rotates the spectrometer's arm to another angle, selects the next channel of the MCA and provides the measurement of the diffracted neutron for the same time period. Such a sequence is repeated automatically over all angles required for the neutron diffraction pattern of the sample under investigation. As a result, the stored information at the MCA provides the neutron diffraction pattern as a function of channel number, where each channel corresponds to a certain scattering angle. The stored distribution at MCA can be obtained through the analyzer read out unit. The designed automatic unit has the possibility of providing the neutron diffraction pattern using a 6-digit scaler and a printer

  13. Surface segregation of InGaAs films by the evolution of reflection high-energy electron diffraction patterns

    International Nuclear Information System (INIS)

    Zhou Xun; Luo Zi-Jiang; Guo Xiang; Zhang Bi-Chan; Shang Lin-Tao; Zhou Qing; Deng Chao-Yong; Ding Zhao

    2012-01-01

    Surface segregation is studied via the evolution of reflection high-energy electron diffraction (RHEED) patterns under different values of As 4 BEP for InGaAs films. When the As 4 BEP is set to be zero, the RHEED pattern keeps a 4×3/(n × 3) structure with increasing temperature, and surface segregation takes place until 470 °C. The RHEED pattern develops into a metal-rich (4 × 2) structure as temperature increases to 495 °C. The reason for this is that surface segregation makes the In inside the InGaAs film climb to its surface. With the temperature increasing up to 515 °C, the RHEED pattern turns into a GaAs(2 × 4) structure due to In desorption. While the As 4 BEP comes up to a specific value (1.33 × 10 -4 Pa−1.33 × 10 -3 Pa), the surface temperature can delay the segregation and desorption. We find that As 4 BEP has a big influence on surface desorption, while surface segregation is more strongly dependent on temperature than surface desorption. (condensed matter: structural, mechanical, and thermal properties)

  14. Bragg's Law diffraction simulations for electron backscatter diffraction analysis

    International Nuclear Information System (INIS)

    Kacher, Josh; Landon, Colin; Adams, Brent L.; Fullwood, David

    2009-01-01

    In 2006, Angus Wilkinson introduced a cross-correlation-based electron backscatter diffraction (EBSD) texture analysis system capable of measuring lattice rotations and elastic strains to high resolution. A variation of the cross-correlation method is introduced using Bragg's Law-based simulated EBSD patterns as strain free reference patterns that facilitates the use of the cross-correlation method with polycrystalline materials. The lattice state is found by comparing simulated patterns to collected patterns at a number of regions on the pattern using the cross-correlation function and calculating the deformation from the measured shifts of each region. A new pattern can be simulated at the deformed state, and the process can be iterated a number of times to converge on the absolute lattice state. By analyzing an iteratively rotated single crystal silicon sample and recovering the rotation, this method is shown to have an angular resolution of ∼0.04 o and an elastic strain resolution of ∼7e-4. As an example of applications, elastic strain and curvature measurements are used to estimate the dislocation density in a single grain of a compressed polycrystalline Mg-based AZ91 alloy.

  15. Quantitative measurement of phase variation amplitude of ultrasonic diffraction grating based on diffraction spectral analysis

    Energy Technology Data Exchange (ETDEWEB)

    Pan, Meiyan, E-mail: yphantomohive@gmail.com; Zeng, Yingzhi; Huang, Zuohua, E-mail: zuohuah@163.com [Laboratory of Quantum Engineering and Quantum Materials, School of Physics and Telecommunication Engineering, South China Normal University, Guangzhou, Guangdong 510006 (China)

    2014-09-15

    A new method based on diffraction spectral analysis is proposed for the quantitative measurement of the phase variation amplitude of an ultrasonic diffraction grating. For a traveling wave, the phase variation amplitude of the grating depends on the intensity of the zeroth- and first-order diffraction waves. By contrast, for a standing wave, this amplitude depends on the intensity of the zeroth-, first-, and second-order diffraction waves. The proposed method is verified experimentally. The measured phase variation amplitude ranges from 0 to 2π, with a relative error of approximately 5%. A nearly linear relation exists between the phase variation amplitude and driving voltage. Our proposed method can also be applied to ordinary sinusoidal phase grating.

  16. Powder diffraction from a continuous microjet of submicrometer protein crystals.

    Science.gov (United States)

    Shapiro, D A; Chapman, H N; Deponte, D; Doak, R B; Fromme, P; Hembree, G; Hunter, M; Marchesini, S; Schmidt, K; Spence, J; Starodub, D; Weierstall, U

    2008-11-01

    Atomic-resolution structures from small proteins have recently been determined from high-quality powder diffraction patterns using a combination of stereochemical restraints and Rietveld refinement [Von Dreele (2007), J. Appl. Cryst. 40, 133-143; Margiolaki et al. (2007), J. Am. Chem. Soc. 129, 11865-11871]. While powder diffraction data have been obtained from batch samples of small crystal-suspensions, which are exposed to X-rays for long periods of time and undergo significant radiation damage, the proof-of-concept that protein powder diffraction data from nanocrystals of a membrane protein can be obtained using a continuous microjet is shown. This flow-focusing aerojet has been developed to deliver a solution of hydrated protein nanocrystals to an X-ray beam for diffraction analysis. This method requires neither the crushing of larger polycrystalline samples nor any techniques to avoid radiation damage such as cryocooling. Apparatus to record protein powder diffraction in this manner has been commissioned, and in this paper the first powder diffraction patterns from a membrane protein, photosystem I, with crystallite sizes of less than 500 nm are presented. These preliminary patterns show the lowest-order reflections, which agree quantitatively with theoretical calculations of the powder profile. The results also serve to test our aerojet injector system, with future application to femtosecond diffraction in free-electron X-ray laser schemes, and for serial crystallography using a single-file beam of aligned hydrated molecules.

  17. Analysis of x-ray diffraction pattern and complex plane impedance plot of polypyrrole/titanium dioxide nanocomposite: A simulation study

    Science.gov (United States)

    Ravikiran, Y. T.; Vijaya Kumari, S. C.

    2013-06-01

    To innovate the properties of Polypyrrole/Titanium dioxide (PPy/TiO2) nanocomposite further, it has been synthesized by chemical polymerization technique. The nanostructure and monoclinic phase of the prepared composite have been confirmed by simulating the X-ray diffraction pattern (XRD). Also, complex plane impedance plot of the composite has been simulated to find equivalent resistance capacitance circuit (RC circuit) and numerical values of R and C have been predicted.

  18. Dictionary Indexing of Electron Channeling Patterns.

    Science.gov (United States)

    Singh, Saransh; De Graef, Marc

    2017-02-01

    The dictionary-based approach to the indexing of diffraction patterns is applied to electron channeling patterns (ECPs). The main ingredients of the dictionary method are introduced, including the generalized forward projector (GFP), the relevant detector model, and a scheme to uniformly sample orientation space using the "cubochoric" representation. The GFP is used to compute an ECP "master" pattern. Derivative free optimization algorithms, including the Nelder-Mead simplex and the bound optimization by quadratic approximation are used to determine the correct detector parameters and to refine the orientation obtained from the dictionary approach. The indexing method is applied to poly-silicon and shows excellent agreement with the calibrated values. Finally, it is shown that the method results in a mean disorientation error of 1.0° with 0.5° SD for a range of detector parameters.

  19. Self-diffraction and Z-scan studies in organic dye doped thin films

    International Nuclear Information System (INIS)

    Madhana Sundari, R.; Palanisamy, P.K.

    2006-01-01

    Self-diffraction in Acid Red 87 (eosin Y) dye doped thin films is studied using argon ion laser (514.5 nm). Growth of self-diffraction grating is monitored by measuring intensities of various diffraction orders. This study has resulted in the observation of phase variation between the contributing beams in any diffracted order. This change of phase is measured at various stages of grating formation. Due to self-phase modulation, circular concentric rings pattern is obtained in the far field. The observed fluctuation in this pattern may be due to the phase variation between the contributing beams in any diffracted order. Z-scan technique is used to study the optical non-linearity of the sample

  20. Diffraction of radiation from channelled charged particles

    International Nuclear Information System (INIS)

    Baryshevskij, V.G.; Grubich, A.O.; Dubovskaya, I.Ya.

    1978-01-01

    An explicit expression for cross-section and radiation spectrum at diffraction is calculated. It is shown that photons emitted by channelled particles form a typical diffraction pattern which contains information about the crystal structure. It is also shown that the change of the longitudinal energy of the particle caused by the radiation braking becomes important when the particle energy is increased. (author)

  1. Rietveld analysis, powder diffraction and cement

    International Nuclear Information System (INIS)

    Peterson, V.

    2002-01-01

    Full text: Phase quantification of cement is essential in its industrial use, however many methods are inaccurate and/or time consuming. Powder diffraction is one of the more accurate techniques used for quantitative phase analysis of cement. There has been an increase in the use of Rietveld refinement and powder diffraction for the analysis and phase quantification of cement and its components in recent years. The complex nature of cement components, existence of solid solutions, polymorphic variation of phases and overlapping phase peaks in diffraction patterns makes phase quantification of cements by powder diffraction difficult. The main phase in cement is alite, a solid solution of tricalcium silicate. Tricalcium silicate has been found to exist in seven modifications in three crystal systems, including triclinic, monoclinic, and rhombohedral structures. Hence, phase quantification of cements using Rietveld methods usually involves the simultaneous modelling of several tricalcium silicate structures to fit the complex alite phase. An industry ordinary Portland cement, industry and standard clinker, and a synthetic tricalcium silicate were characterised using neutron, laboratory x-ray and synchrotron powder diffraction. Diffraction patterns were analysed using full-profile Rietveld refinement. This enabled comparison of x-ray, neutron and synchrotron data for phase quantification of the cement and examination of the tricalcium silicate. Excellent Rietveld fits were achieved, however the results showed that the quantitative phase analysis results differed for some phases in the same clinker sample between various data sources. This presentation will give a short introduction about cement components including polymorphism, followed by the presentation of some problems in phase quantification of cements and the role of Rietveld refinement in solving these problems. Copyright (2002) Australian X-ray Analytical Association Inc

  2. Study of caprine bones after moist and dry heat processes by X-ray diffraction

    International Nuclear Information System (INIS)

    Barbosa, Caroline M.; Azeredo, Soraia R.; Lopes, Ricardo T.; Souza, Sheila M.F.M de

    2013-01-01

    Bone tissue is a biological material composed of hydroxyapatite (HAp) and collagen matrix. The bone X-ray diffraction (XRD) pattern presents characteristics of the hydroxyapatite crystallography planes. This paper presents the characterization by X-ray diffraction of caprine bone powder pattern and the comparison of this pattern with moist or dry heat cooked bone patterns. The parameters chosen to characterize the X-ray diffraction peaks were: angular position (2θ), full width at half maximumt (FWHM), and relative intensity (I rel ). The X-ray diffraction patterns were obtained with a Shimadzu XRD-6000 diffractometer. The caprine bone XRD pattern revealed a significant correlation of several crystallographic parameters (lattice data) with hydroxyapatite. The profiles of the three bone types analyzed presented differences. The study showed as small angular displacement (decrease of the 2θ angle) of some peaks was observed after moist and dry heat cooking processes. The characterization of bone tissue aimed to contribute to future analysis in the field of archeology. (author)

  3. Study of caprine bones after moist and dry heat processes by X-ray diffraction

    Energy Technology Data Exchange (ETDEWEB)

    Barbosa, Caroline M., E-mail: carolmattosb@yahoo.com.br [Instituto de Arqueologia Brasileira (IAB), Belford Roxo, RJ (Brazil); Azeredo, Soraia R.; Lopes, Ricardo T., E-mail: soraia@lin.ufrj.br [Coordenacao dos Programas de Pos-Graduacao em Engenharia (COPPE/LIN/UFRJ), Rio de Janeiro, RJ (Brazil). Laboratorio de Instrumentacao Nuclear; Souza, Sheila M.F.M de, E-mail: sferraz@ensp.fiocruz.br [Fundacao Oswaldo Cruz (ENSP/FIOCRUZ), Rio de Janeiro, RJ (Brazil). Escola Nacional de Saude Publica Sergio Arouca

    2013-07-01

    Bone tissue is a biological material composed of hydroxyapatite (HAp) and collagen matrix. The bone X-ray diffraction (XRD) pattern presents characteristics of the hydroxyapatite crystallography planes. This paper presents the characterization by X-ray diffraction of caprine bone powder pattern and the comparison of this pattern with moist or dry heat cooked bone patterns. The parameters chosen to characterize the X-ray diffraction peaks were: angular position (2θ), full width at half maximumt (FWHM), and relative intensity (I{sub rel}). The X-ray diffraction patterns were obtained with a Shimadzu XRD-6000 diffractometer. The caprine bone XRD pattern revealed a significant correlation of several crystallographic parameters (lattice data) with hydroxyapatite. The profiles of the three bone types analyzed presented differences. The study showed as small angular displacement (decrease of the 2θ angle) of some peaks was observed after moist and dry heat cooking processes. The characterization of bone tissue aimed to contribute to future analysis in the field of archeology. (author)

  4. An engineered design of a diffractive mask for high precision astrometry

    Science.gov (United States)

    Dennison, Kaitlin; Ammons, S. Mark; Garrel, Vincent; Marin, Eduardo; Sivo, Gaetano; Bendek, Eduardo; Guyon, Oliver

    2016-07-01

    AutoCAD, Zemax Optic Studio 15, and Interactive Data Language (IDL) with the Proper Library are used to computationally model and test a diffractive mask (DiM) suitable for use in the Gemini Multi-Conjugate Adaptive Optics System (GeMS) on the Gemini South Telescope. Systematic errors in telescope imagery are produced when the light travels through the adaptive optics system of the telescope. DiM is a transparent, flat optic with a pattern of miniscule dots lithographically applied to it. It is added ahead of the adaptive optics system in the telescope in order to produce diffraction spots that will encode systematic errors in the optics after it. Once these errors are encoded, they can be corrected for. DiM will allow for more accurate measurements in astrometry and thus improve exoplanet detection. The mechanics and physical attributes of the DiM are modeled in AutoCAD. Zemax models the ray propagation of point sources of light through the telescope. IDL and Proper simulate the wavefront and image results of the telescope. Aberrations are added to the Zemax and IDL models to test how the diffraction spots from the DiM change in the final images. Based on the Zemax and IDL results, the diffraction spots are able to encode the systematic aberrations.

  5. Spider diffraction: a comparison of curved and straight legs

    International Nuclear Information System (INIS)

    Richter, J.L.

    1984-01-01

    It has been known for some time that, if curved legs rather than the usual straight ones are used in the spider that supports the secondary optics in certain telescopes, the visible diffraction effect is reduced. Fraunhofer theory is used to calculate the diffraction effects due to the curved leg spider. Calculated and photographic diffraction patterns are compared for straight and curved leg spiders

  6. Extra spots in the electron diffraction patterns of neutron irradiated zirconium and its alloys

    International Nuclear Information System (INIS)

    Madden, P.K.

    1977-01-01

    Specimens of neutron irradiated zirconium and its alloys were examined in the transmission electron microscope. Groups of extra spots, often exhibiting four-fold symmetry, were observed in thin foil electron diffraction patterns of these specimens. The 'extra-spot' structure, like the expected black-dot/small scale dislocation loop neutron irradiated damage, is approximately 100 A in size. Its nature is uncertain. It may be related to irradiation damage or to some artefact introduced during specimen preparation. If it is the latter, then published irradiation damage defect size distributions and determined irradiation growth strains of other investigators, may require modification. The present inconclusive results indicate that extra-spot structure is likely to consist of oxide particles, but may correspond to hydride precipitation or decoration effects, or even, to electron beam effects. (author)

  7. Electron diffraction study of {alpha}-AlMnSi crystals including non-crystallographic axes

    Energy Technology Data Exchange (ETDEWEB)

    Song, G.L.; Bursill, L.A.

    1997-06-01

    The structure of crystalline {alpha}-AlMnSi is examined by electron diffraction. Six distinct zone axes are examined, including both normal crystallographic and non-crystallographic zones axes, allowing the space group symmetry to be studied. Electron diffraction patterns characteristic of Pm3-bar were obtained for thicker specimens. However, for very thin specimens, as used for HRTEM imaging, the electron diffraction patterns were characteristic of Im3-bar space group symmetry. The structural basis of the Pm3-bar to Im3-bar transformation may be understood in terms of an analysis of the icosahedral structural elements located at the corners and body-centers of the cubic unit cell. A method for indexing the non-crystallographic zone axis diffraction patterns is described. An electron diffraction pattern of the 5-fold axis of the quasicrystalline phase i-AlMnSi is also included; this is compared with the experimental results and calculations for the [0{tau}1] axis of Pm3-bar and Im3-bar crystalline phases. 26 refs., 4 tabs., 7 figs.

  8. Correlation between the dielectric constant and X-ray diffraction pattern of Si-O-C thin films with hydrogen bonds

    International Nuclear Information System (INIS)

    Oh, Teresa; Oh, Kyoung Suk; Lee, Kwang-Man; Choi, Chi Kyu

    2004-01-01

    The amorphous structure of organic-inorganic hybrid type Si-O-C thin films was studied using the first principles molecular-dynamics method with density functional techniques. The correlation between the dielectric constant and the degree of amorphous structure in organic-inorganic hybrid type Si-O-C thin films was studied. Si-O-C thin films were deposited by high-density plasma chemical vapor deposition using bis-trimethylsilylmethane and oxygen precursors. As-deposited films and films annealed at 500 deg. C were analyzed by X-ray diffraction (XRD). For quantitative analysis, the X-ray diffraction patterns of the samples were transformed to the radial distribution function (RDF) using Fourier analysis. Hybrid type Si-O-C thin films can be divided into three types using their amorphous structure and the dielectric constant: those with organic, hybrid, and inorganic properties

  9. Recording of X-ray diffraction patterns for the investigation of transient changes in the crystalline structure of materials subjected to the action of shock waves

    International Nuclear Information System (INIS)

    Jamet, F.; Thomer, G.

    An arrangement including a flash X-ray tube and an image intensifier has been designed and built in order to record X-ray diffraction patterns with exposure times of the order of 100nsec. This arrangement allows Laue patterns (polychromatic radiation) as well as powder patterns (copper K(α) radiation) to be recorded. Examples for record are shown. As an application to the investigation of transient changes in crystalline structures, the Debye-Scherrer patterns of potassium chloride undergoing the dynamic action of shock waves were recorded. The first results achieved are discussed [fr

  10. Hair treatment process providing dispersed colors by light diffraction

    Science.gov (United States)

    Sutton, Richard Matthew Charles; Lamartine, Bruce Carvell; Orler, E. Bruce; Song, Shuangqi

    2015-12-22

    A hair treatment process for providing dispersed colors by light diffraction including (a) coating the hair with a material comprising a polymer, (b) pressing the hair with a pressing device including one or more surfaces, and (c) forming a secondary nanostructured surface pattern on the hair that is complementary to the primary nanostructured surface pattern on the one or more surfaces of the pressing device. The secondary nanostructured surface pattern diffracts light into dispersed colors that are visible on the hair. The section of the hair is pressed with the pressing device for from about 1 to 55 seconds. The polymer has a glass transition temperature from about 55.degree. C. to about 90.degree. C. The one or more surfaces include a primary nanostructured surface pattern.

  11. Powder diffraction

    Energy Technology Data Exchange (ETDEWEB)

    Hart, M.

    1995-12-31

    the importance of x-ray powder diffraction as an analytical tool for phase identification of materials was first pointed out by Debye and Scherrer in Germany and, quite independently, by Hull in the US. Three distinct periods of evolution lead to ubiquitous application in many fields of science and technology. In the first period, until the mid-1940`s, applications were and developed covering broad categories of materials including inorganic materials, minerals, ceramics, metals, alloys, organic materials and polymers. During this formative period, the concept of quantitative phase analysis was demonstrated. In the second period there followed the blossoming of technology and commercial instruments became widely used. The history is well summarized by Parrish and by Langford and Loueer. By 1980 there were probably 10,000 powder diffractometers in routine use, making it the most widely used of all x-ray crystallographic instruments. In the third, present, period data bases became firmly established and sophisticated pattern fitting and recognition software made many aspects of powder diffraction analysis routine. High resolution, tunable powder diffractometers were developed at sources of synchrotron radiation. The tunability of the spectrum made it possible to exploit all the subtleties of x-ray spectroscopy in diffraction experiments.

  12. Powder diffraction

    International Nuclear Information System (INIS)

    Hart, M.

    1995-01-01

    The importance of x-ray powder diffraction as an analytical tool for phase identification of materials was first pointed out by Debye and Scherrer in Germany and, quite independently, by Hull in the US. Three distinct periods of evolution lead to ubiquitous application in many fields of science and technology. In the first period, until the mid-1940's, applications were and developed covering broad categories of materials including inorganic materials, minerals, ceramics, metals, alloys, organic materials and polymers. During this formative period, the concept of quantitative phase analysis was demonstrated. In the second period there followed the blossoming of technology and commercial instruments became widely used. The history is well summarized by Parrish and by Langford and Loueer. By 1980 there were probably 10,000 powder diffractometers in routine use, making it the most widely used of all x-ray crystallographic instruments. In the third, present, period data bases became firmly established and sophisticated pattern fitting and recognition software made many aspects of powder diffraction analysis routine. High resolution, tunable powder diffractometers were developed at sources of synchrotron radiation. The tunability of the spectrum made it possible to exploit all the subtleties of x-ray spectroscopy in diffraction experiments

  13. A Dynamic Interval-Valued Intuitionistic Fuzzy Sets Applied to Pattern Recognition

    Directory of Open Access Journals (Sweden)

    Zhenhua Zhang

    2013-01-01

    Full Text Available We present dynamic interval-valued intuitionistic fuzzy sets (DIVIFS, which can improve the recognition accuracy when they are applied to pattern recognition. By analyzing the degree of hesitancy, we propose some DIVIFS models from intuitionistic fuzzy sets (IFS and interval-valued IFS (IVIFS. And then we present a novel ranking condition on the distance of IFS and IVIFS and introduce some distance measures of DIVIFS satisfying the ranking condition. Finally, a pattern recognition example applied to medical diagnosis decision making is given to demonstrate the application of DIVIFS and its distances. The simulation results show that the DIVIFS method is more comprehensive and flexible than the IFS method and the IVIFS method.

  14. Multiple x-ray diffraction applied to the study of crystal impurities

    International Nuclear Information System (INIS)

    Cardoso, L.P.

    1983-06-01

    The x-ray multiple diffraction technique is used in the study of impurities concentration and localization in the crystal lattice, implemented with the fundamental observation that the impurities cannot be distributed with the same spatial group symmetry of the crystal. This fact could introduce scattered intensity in the crystal reciprocal lattice forbidden nodes. This effect was effectively observed in multiple diffraction diagrams, where a reinforcement of the scattered intensity in the pure crystal is produced, when choosing conveniently the involved reflections. The reflectivity theory was developed in the kinematic case, which take into account the scattering by the impurities atoms, and the analysis showed that, in the first approximation, the impurities can influence both in the allowed and forbidden positions for the pure crystal. (L.C.J.A.)

  15. Fourier-Based Diffraction Analysis of Live Caenorhabditis elegans.

    Science.gov (United States)

    Magnes, Jenny; Hastings, Harold M; Raley-Susman, Kathleen M; Alivisatos, Clara; Warner, Adam; Hulsey-Vincent, Miranda

    2017-09-13

    This manuscript describes how to classify nematodes using temporal far-field diffraction signatures. A single C. elegans is suspended in a water column inside an optical cuvette. A 632 nm continuous wave HeNe laser is directed through the cuvette using front surface mirrors. A significant distance of at least 20-30 cm traveled after the light passes through the cuvette ensures a useful far-field (Fraunhofer) diffraction pattern. The diffraction pattern changes in real time as the nematode swims within the laser beam. The photodiode is placed off-center in the diffraction pattern. The voltage signal from the photodiode is observed in real time and recorded using a digital oscilloscope. This process is repeated for 139 wild type and 108 "roller" C. elegans. Wild type worms exhibit a rapid oscillation pattern in solution. The "roller" worms have a mutation in a key component of the cuticle that interferes with smooth locomotion. Time intervals that are not free of saturation and inactivity are discarded. It is practical to divide each average by its maximum to compare relative intensities. The signal for each worm is Fourier transformed so that the frequency pattern for each worm emerges. The signal for each type of worm is averaged. The averaged Fourier spectra for the wild type and the "roller" C. elegans are distinctly different and reveal that the dynamic worm shapes of the two different worm strains can be distinguished using Fourier analysis. The Fourier spectra of each worm strain match an approximate model using two different binary worm shapes that correspond to locomotory moments. The envelope of the averaged frequency distribution for actual and modeled worms confirms the model matches the data. This method can serve as a baseline for Fourier analysis for many microscopic species, as every microorganism will have its unique Fourier spectrum.

  16. Diffraction of polarized light on periodic structures

    International Nuclear Information System (INIS)

    Bukanina, V; Divakov, D; Tyutyunnik, A; Hohlov, A

    2012-01-01

    Periodic structures as photonic crystals are widely used in modern laser devices, communication technologies and for creating various beam splitters and filters. Diffraction gratings are applied for creating 3D television sets, DVD and Blu-ray drives and reflective structures (Berkley mirror). It is important to simulate diffraction on such structures to design optical systems with predetermined properties based on photonic crystals and diffraction gratings. Methods of simulating diffraction on periodic structures uses theory of Floquet-Bloch and rigorous coupled-wave analysis (RCWA). Current work is dedicated to analysis of photonic band gaps and simulating diffraction on one-dimensional binary diffraction grating using RCWA. The Maxwell's equations for isotropic media and constitutive relations based on the cgs system were used as a model.

  17. Three-dimensional Bragg diffraction in growth-disordered opals

    Science.gov (United States)

    Baryshev, A. V.; Kaplyanskii, Alexander A.; Kosobukin, Vladimir A.; Limonov, M. F.; Samusev, K. B.; Usvyat, D. E.

    2003-06-01

    After artificial opals as well as opal-based infilled and inverted composites are considered to be promising representatives of photonic crystal materials. Earlier, photonic stop gaps in opals were studied mainly in transmission or specular reflection geometries corresponding to "one-dimensional" Bragg diffraction. On the contrary, this work was aimed at observing the typical patterns of optical Bragg diffraction in which phenomenon opal crystal structure acts as a three-dimensional diffraction grating. Although our experiments were performed for artificial opals possessing unavoidable imperfections a well-pronounced diffraction peaks were observed characteristic of a crystal structure. Each of the diffraction maxima reveals a photonic stop gap in the specified direction, while the spectral width of the peak is a measure of the photonic stop gap width.

  18. Structural refinement and extraction of hydrogen atomic positions in polyoxymethylene crystal based on the first successful measurements of 2-dimensional high-energy synchrotron X-ray diffraction and wide-angle neutron diffraction patterns of hydrogenated and deuterated species

    International Nuclear Information System (INIS)

    Tashiro, Kohji; Hanesaka, Makoto; Ohhara, Takashi; Kurihara, Kazuo; Tamada, Taro; Kuroki, Ryota; Fujiwara, Satoru; Ozeki, Tomoji; Kitano, Toshiaki; Nishu, Takashi; Tanaka, Ichiro; Niimura, Nobuo

    2007-01-01

    2-Dimensional X-ray and neutron diffraction patterns have been successfully measured for deuterated and hydrogenated polyoxymethylene (POM) samples obtained by γ-ray induced solid-state polymerization reaction. More than 700 reflections were collected from the X-ray diffraction data at -150degC by utilizing a high-energy synchrotron X-ray beam at SPring-8, Japan, from which the crystal structure of POM has been refined thoroughly including the extraction of hydrogen atomic positions at clearly seen in the difference Fourier synthesis map. As the first trial the nonuniform (9/5) helical model was analyzed with the reliability factor (R factor) 6.9%. The structural analysis was made also using the X-ray reflections of about 400 observed at room temperature (R 8.8%), and the thermal parameters of constituent atoms were compared between the low and high temperatures to discuss the librational thermal motion of the chains. The 2-dimensional neutron diffraction data, collected for the deuterated and hydrogenated POM samples using an imaging plate system specifically built-up for neutron scattering experiment, have allowed us to pick up the D and H atomic positions clearly in the Fourier synthesis maps. Another possible model, (29/16) helix, which was proposed by several researches, has been also investigated on the basis of the X-ray diffraction data at -150degC. The direct method succeeded in extracting this (29/16) model straightforwardly. The R factor was 8.6%, essentially the same as that of (9/5) helical model. This means that the comparison of the diffraction intensity between the data collected from the full-rotation X-ray diffraction pattern and the intensity calculated for both the (9/5) and (29/16) models cannot be used for the unique determination of the superiority of the model, (9/5) or (29/16) helix. However, we have found the existence of 001 and 002 reflections which give the longer repeating period 55.7 A. Besides there observed a series of meridional

  19. Structure of 3 at.% and 9 at.% Si-doped HfO{sub 2} from combined refinement of X-ray and neutron diffraction patterns

    Energy Technology Data Exchange (ETDEWEB)

    Zhao, Lili [Department of Materials Science and Engineering, North Carolina State University, NC 27695 (United States); School of Information Science and Technology, Northwest University, Xi' an 710127 (China); Hou, Dong; Usher, Tedi-Marie; Iamsasri, Thanakorn; Fancher, Chris M.; Forrester, Jennifer S. [Department of Materials Science and Engineering, North Carolina State University, NC 27695 (United States); Nishida, Toshikazu [Department of Electrical and Computer Engineering, University of Florida, FL 32611 (United States); Moghaddam, Saeed [Department of Mechanical and Aerospace Engineering, University of Florida, FL 32611 (United States); Jones, Jacob L., E-mail: jacobjones@ncsu.edu [Department of Materials Science and Engineering, North Carolina State University, NC 27695 (United States)

    2015-10-15

    The crystal structure of 3 at.% and 9 at.% Si-doped HfO{sub 2} powder was determined through refinements using X-ray and neutron diffraction patterns. The lattice parameters, atomic positions, dopant occupancy, and the second phase fraction were determined with high precision using a combined full pattern fitting via the Rietveld method. The results show that both 3 at.% and 9 at.% Si-doped HfO{sub 2} powder exhibit the monoclinic crystal structure with P 1 2{sub 1}/c 1 space group. Through the combined refinement, the crystal structure parameters, especially for the positions and occupancies of the lighter atoms, were more precisely determined compared to independent X-ray diffraction refinement. Although the ionic radius of Si{sup 4+} is smaller than Hf{sup 4+}, with increasing Si occupancy, the unit cell volume slightly increases; possible mechanisms for this effect are discussed. Moreover, the refined results provide evidence of the existence of a non-equilibrium phase of Hf{sub x}Si{sub 1−x}O{sub 2}. The second phase (SiO{sub 2}) fraction is determined as 0.17 at.% for 3 at.% Si-doped HfO{sub 2} powders and 1.7 at.% for 9 at.% Si-doped HfO{sub 2} powders. - Highlights: • X-ray and neutron diffraction patterns were used to determine crystal structure. • Results from independent refinements and a combined refinement were compared. • Highly precise structural parameters were obtained by the combined refinement. • Structural data of 3 at.% and 9 at.% Si-doped HfO{sub 2} are provided. • The unit cell volume slightly increases with Si concentration from 3 to 9 at.%.

  20. LEED (Low Energy Electron Diffraction)

    International Nuclear Information System (INIS)

    Aberdam, M.

    1973-01-01

    The various types of systems studied by LEED, and for which the geometry of diffraction patterns is exploited, are reviewed, intensity profiles being another source of information. Two representative approaches of the scattering phenomenon are examined; the band structure theory and the T matrix approach [fr

  1. Theoretical study of the properties of X-ray diffraction moiré fringes. I

    International Nuclear Information System (INIS)

    Yoshimura, Jun-ichi

    2015-01-01

    A detailed and comprehensive theoretical description of X-ray diffraction moiré fringes for a bicrystal specimen is given on the basis of a calculation by plane-wave dynamical diffraction theory, where the effect of the Pendellösung intensity oscillation on the moiré pattern is explained in detail. A detailed and comprehensive theoretical description of X-ray diffraction moiré fringes for a bicrystal specimen is given on the basis of a calculation by plane-wave dynamical diffraction theory. Firstly, prior to discussing the main subject of the paper, a previous article [Yoshimura (1997 ▸). Acta Cryst. A53, 810–812] on the two-dimensionality of diffraction moiré patterns is restated on a thorough calculation of the moiré interference phase. Then, the properties of moiré fringes derived from the above theory are explained for the case of a plane-wave diffraction image, where the significant effect of Pendellösung intensity oscillation on the moiré pattern when the crystal is strained is described in detail with theoretically simulated moiré images. Although such plane-wave moiré images are not widely observed in a nearly pure form, knowledge of their properties is essential for the understanding of diffraction moiré fringes in general

  2. Semiclassical perturbation theory for diffraction in heavy atom surface scattering.

    Science.gov (United States)

    Miret-Artés, Salvador; Daon, Shauli; Pollak, Eli

    2012-05-28

    The semiclassical perturbation theory formalism of Hubbard and Miller [J. Chem. Phys. 78, 1801 (1983)] for atom surface scattering is used to explore the possibility of observation of heavy atom diffractive scattering. In the limit of vanishing ℏ the semiclassical theory is shown to reduce to the classical perturbation theory. The quantum diffraction pattern is sensitive to the characteristics of the beam of incoming particles. Necessary conditions for observation of quantum diffraction are derived for the angular width of the incoming beam. An analytic expression for the angular distribution as a function of the angular and momentum variance of the incoming beam is obtained. We show both analytically and through some numerical results that increasing the angular width of the incident beam leads to decoherence of the quantum diffraction peaks and one approaches the classical limit. However, the incoherence of the beam in the parallel direction does not destroy the diffraction pattern. We consider the specific example of Ar atoms scattered from a rigid LiF(100) surface.

  3. Diffraction gauging

    International Nuclear Information System (INIS)

    Wilkens, P.H.

    1978-01-01

    This system of gauging is now being designed to fit on an Excello NC lathe to measure the form, accuracy, and size of external contoured surfaces as they approach the finish machined size. A template profile of the finished workpiece, but 0.003 in. bigger on radius, will be aligned with the workpiece using a reference diameter and face on the machining fixture to leave a gap between the profile of the template and workpiece. A helium--neon laser beam will be projected through this gap using a rotating retroreflector and a fixed laser. The resulting diffraction pattern produced by the laser beam passing through the template to workpiece gap will be reflected and focused on a fixed diode array via a second retroreflector which moves and remains in optical alignment with the first. These retroreflectors will be rotated about a center that will enable the laser beam, which is shaped in a long slit, to scan the template workpiece gap from the pole to the equator of the workpiece. The characteristic diffraction pattern will be detected by the fixed diode array, and the signal levels from this array will be processed in a mini-computer programmed to produce a best fit through the two minima of the diode signals. The separation of the two minima will yield the size of the workpiece to template gap and this information will be presented to the machine tool operator

  4. Adaptable Diffraction Gratings With Wavefront Transformation

    Science.gov (United States)

    Iazikov, Dmitri; Mossberg, Thomas W.; Greiner, Christoph M.

    2010-01-01

    Diffraction gratings are optical components with regular patterns of grooves, which angularly disperse incoming light by wavelength. Traditional diffraction gratings have static planar, concave, or convex surfaces. However, if they could be made so that they can change the surface curvature at will, then they would be able to focus on particular segments, self-calibrate, or perform fine adjustments. This innovation creates a diffraction grating on a deformable surface. This surface could be bent at will, resulting in a dynamic wavefront transformation. This allows for self-calibration, compensation for aberrations, enhancing image resolution in a particular area, or performing multiple scans using different wavelengths. A dynamic grating gives scientists a new ability to explore wavefronts from a variety of viewpoints.

  5. Small area analysis using micro-diffraction techniques

    International Nuclear Information System (INIS)

    Goehner, Raymond P.; Tissot, Ralph G. Jr.; Michael, Joseph R.

    2000-01-01

    An overall trend toward smaller electronic packages and devices makes it increasingly important and difficult to obtain meaningful diffraction information from small areas. X-ray micro-diffraction, electron back-scattered diffraction (EBSD) and Kossel are micro-diffraction techniques used for crystallographic analysis including texture, phase identification and strain measurements. X-ray micro-diffraction primarily is used for phase analysis and residual strain measurements. X-ray micro-diffraction primarily is used for phase analysis and residual strain measurements of areas between 10 microm to 100 microm. For areas this small glass capillary optics are used for producing a usable collimated x-ray beam. These optics are designed to reflect x-rays below the critical angle therefore allowing for larger solid acceptance angle at the x-ray source resulting in brighter smaller x-ray beams. The determination of residual strain using micro-diffraction techniques is very important to the semiconductor industry. Residual stresses have caused voiding of the interconnect metal which then destroys electrical continuity. Being able to determine the residual stress helps industry to predict failures from the aging effects of interconnects due to this stress voiding. Stress measurements would be impossible using a conventional x-ray diffractometer; however, utilizing a 30 microm glass capillary these small areas are readily assessable for analysis. Kossel produces a wide angle diffraction pattern from fluorescent x-rays generated in the sample by an e-beam in a SEM. This technique can yield very precise lattice parameters for determining strain. Fig. 2 shows a Kossel pattern from a Ni specimen. Phase analysis on small areas is also possible using an energy dispersive spectrometer (EBSD) and x-ray micro-diffraction techniques. EBSD has the advantage of allowing the user to observe the area of interest using the excellent imaging capabilities of the SEM. An EDS detector has been

  6. Ultrafast electron diffraction using an ultracold source

    Directory of Open Access Journals (Sweden)

    M. W. van Mourik

    2014-05-01

    Full Text Available The study of structural dynamics of complex macromolecular crystals using electrons requires bunches of sufficient coherence and charge. We present diffraction patterns from graphite, obtained with bunches from an ultracold electron source, based on femtosecond near-threshold photoionization of a laser-cooled atomic gas. By varying the photoionization wavelength, we change the effective source temperature from 300 K to 10 K, resulting in a concomitant change in the width of the diffraction peaks, which is consistent with independently measured source parameters. This constitutes a direct measurement of the beam coherence of this ultracold source and confirms its suitability for protein crystal diffraction.

  7. Three-dimensional x-ray diffraction detection and visualization

    International Nuclear Information System (INIS)

    Allahkarami, Masoud; Hanan, Jay C

    2014-01-01

    A new method of sensing and analyzing three-dimensional (3D) x-ray diffraction (XRD) cones was introduced. Using a two-dimensional area detector, a sequence of frames was collected while moving the detector away from the sample with small equally spaced steps and keeping all other parameters constant. A 3D dataset was created from the subsequent frames. The 3D x-ray diffraction (XRD 3 ) pattern contains far more information than a one-dimensional profile collected with the conventional diffractometer and 2D x-ray diffraction (XRD 2 ). The present work discusses some fundamentals about XRD 3 , such as the data collection method, 3D visualization, diffraction data interpretation and potential applications of XRD 3 . (paper)

  8. Practical considerations in the calculation of orientation distribution functions from electron back-scattered diffraction patterns

    International Nuclear Information System (INIS)

    Bowen, A.W.

    1994-01-01

    Using model data sets for the Brass orientation, the importance of scatter width, angular accuracy and grain size and volume fraction on the sensitivity of the calculated Orientation Distribution Functions have been determined in order to highlight some of the practical considerations needed in the processing of experimental data from individual grain orientation measurements determined by the Electron Back-Scattered Diffraction technique. It is suggested that the most appropriate scatter width can be calculated from the maximum function height versus scatter width curve in order to accommodate variations in texture sharpness. The sensitivity of the ODF to careful sample preparation, mounting and pattern analysis, in order to keep errors in angular accuracy to 1 or less is demonstrated, as is the imperative need to correct for the size of grains, and their volume fractions. (orig.)

  9. Bragg's Law diffraction simulations for electron backscatter diffraction analysis

    Energy Technology Data Exchange (ETDEWEB)

    Kacher, Josh, E-mail: jkacherbyu@gmail.com [Department of Mechanical Engineering, Brigham Young University, 455B Crabtree Technology Building, Provo, UT 84602 (United States); Landon, Colin; Adams, Brent L.; Fullwood, David [Department of Mechanical Engineering, Brigham Young University, 455B Crabtree Technology Building, Provo, UT 84602 (United States)

    2009-08-15

    In 2006, Angus Wilkinson introduced a cross-correlation-based electron backscatter diffraction (EBSD) texture analysis system capable of measuring lattice rotations and elastic strains to high resolution. A variation of the cross-correlation method is introduced using Bragg's Law-based simulated EBSD patterns as strain free reference patterns that facilitates the use of the cross-correlation method with polycrystalline materials. The lattice state is found by comparing simulated patterns to collected patterns at a number of regions on the pattern using the cross-correlation function and calculating the deformation from the measured shifts of each region. A new pattern can be simulated at the deformed state, and the process can be iterated a number of times to converge on the absolute lattice state. By analyzing an iteratively rotated single crystal silicon sample and recovering the rotation, this method is shown to have an angular resolution of {approx}0.04{sup o} and an elastic strain resolution of {approx}7e-4. As an example of applications, elastic strain and curvature measurements are used to estimate the dislocation density in a single grain of a compressed polycrystalline Mg-based AZ91 alloy.

  10. Revisit to diffraction anomalous fine structure

    International Nuclear Information System (INIS)

    Kawaguchi, T.; Fukuda, K.; Tokuda, K.; Shimada, K.; Ichitsubo, T.; Oishi, M.; Mizuki, J.; Matsubara, E.

    2014-01-01

    The diffraction anomalous fine structure method has been revisited by applying this measurement technique to polycrystalline samples and using an analytical method with the logarithmic dispersion relation. The diffraction anomalous fine structure (DAFS) method that is a spectroscopic analysis combined with resonant X-ray diffraction enables the determination of the valence state and local structure of a selected element at a specific crystalline site and/or phase. This method has been improved by using a polycrystalline sample, channel-cut monochromator optics with an undulator synchrotron radiation source, an area detector and direct determination of resonant terms with a logarithmic dispersion relation. This study makes the DAFS method more convenient and saves a large amount of measurement time in comparison with the conventional DAFS method with a single crystal. The improved DAFS method has been applied to some model samples, Ni foil and Fe 3 O 4 powder, to demonstrate the validity of the measurement and the analysis of the present DAFS method

  11. Energy-dispersive X-ray diffraction beamline at Indus-2 synchrotron ...

    Indian Academy of Sciences (India)

    An energy-dispersive X-ray diffraction beamline has been designed, developed and commissioned at BL-11 bending magnet port of the Indian synchrotron source, Indus-2. The performance of this beamline has been benchmarked by measuring diffraction patterns from various elemental metals and standard inorganic ...

  12. A Simple Diffraction Experiment Using Banana Stem as a Natural Grating

    Science.gov (United States)

    Aji, Mahardika Prasetya; Karunawan, Jotti; Chasanah, Widyastuti Rochimatun; Nursuhud, Puji Iman; Wiguna, Pradita Ajeng; Sulhadi

    2017-01-01

    A simple diffraction experiment was designed using banana stem as natural grating. Coherent beams of lasers with wavelengths of 632.8 nm and 532 nm that pass through banana stem produce periodic diffraction patterns on a screen. The diffraction experiments were able to measure the distances between the slit of the banana stem, i.e. d = (28.76 ±…

  13. Submicron X-ray diffraction

    International Nuclear Information System (INIS)

    MacDowell, Alastair; Celestre, Richard; Tamura, Nobumichi; Spolenak, Ralph; Valek, Bryan; Brown, Walter; Bravman, John; Padmore, Howard; Batterman, Boris; Patel, Jamshed

    2000-01-01

    At the Advanced Light Source in Berkeley the authors have instrumented a beam line that is devoted exclusively to x-ray micro diffraction problems. By micro diffraction they mean those classes of problems in Physics and Materials Science that require x-ray beam sizes in the sub-micron range. The instrument is for instance, capable of probing a sub-micron size volume inside micron sized aluminum metal grains buried under a silicon dioxide insulating layer. The resulting Laue pattern is collected on a large area CCD detector and automatically indexed to yield the grain orientation and deviatoric (distortional) strain tensor of this sub-micron volume. A four-crystal monochromator is then inserted into the beam, which allows monochromatic light to illuminate the same part of the sample. Measurement of diffracted photon energy allows for the determination of d spacings. The combination of white and monochromatic beam measurements allow for the determination of the total strain/stress tensor (6 components) inside each sub-micron sized illuminated volume of the sample

  14. Microstructural analysis in the depth direction of a heteroepitaxial AlN thick film grown on a trench-patterned template by nanobeam X-ray diffraction

    Science.gov (United States)

    Shida, K.; Takeuchi, S.; Tohei, T.; Miyake, H.; Hiramatsu, K.; Sumitani, K.; Imai, Y.; Kimura, S.; Sakai, A.

    2018-04-01

    This work quantitatively assessed the three-dimensional distribution of crystal lattice distortions in an epitaxial AlN thick film grown on a trench-patterned template, using nanobeam X-ray diffraction. Position-dependent ω-2θ-φ mapping clearly demonstrated local tilting, spacing and twisting of lattice planes as well as fluctuations in these phenomena on a sub-micrometer scale comparable to the pitch of the trench-and-terrace patterning. Analysis of the crystal lattice distortion in the depth direction was performed using a newly developed method in which the X-ray nanobeam diffracted from the sample surface to specific depths can be selectively detected by employing a Pt wire profiler. This technique generated depth-resolved ω-2θ-φ maps confirming that fluctuations in lattice plane tilting and spacing greatly depend on the dislocation distribution and the history of the AlN epitaxial growth on the trench-patterned structure. It was also found that both fluctuations were reduced on approaching the AlN surface and, in particular, were sharply reduced at specific depths in the terrace regions. These sharp reductions are attributed to the formation of sacrificial zones with degraded crystal quality around the trenches and possibly lead to raising the crystal quality near the surface of the AlN film.

  15. Three-dimensional electron diffraction as a complementary technique to powder X-ray diffraction for phase identification and structure solution of powders

    Directory of Open Access Journals (Sweden)

    Yifeng Yun

    2015-03-01

    Full Text Available Phase identification and structure determination are important and widely used techniques in chemistry, physics and materials science. Recently, two methods for automated three-dimensional electron diffraction (ED data collection, namely automated diffraction tomography (ADT and rotation electron diffraction (RED, have been developed. Compared with X-ray diffraction (XRD and two-dimensional zonal ED, three-dimensional ED methods have many advantages in identifying phases and determining unknown structures. Almost complete three-dimensional ED data can be collected using the ADT and RED methods. Since each ED pattern is usually measured off the zone axes by three-dimensional ED methods, dynamic effects are much reduced compared with zonal ED patterns. Data collection is easy and fast, and can start at any arbitrary orientation of the crystal, which facilitates automation. Three-dimensional ED is a powerful technique for structure identification and structure solution from individual nano- or micron-sized particles, while powder X-ray diffraction (PXRD provides information from all phases present in a sample. ED suffers from dynamic scattering, while PXRD data are kinematic. Three-dimensional ED methods and PXRD are complementary and their combinations are promising for studying multiphase samples and complicated crystal structures. Here, two three-dimensional ED methods, ADT and RED, are described. Examples are given of combinations of three-dimensional ED methods and PXRD for phase identification and structure determination over a large number of different materials, from Ni–Se–O–Cl crystals, zeolites, germanates, metal–organic frameworks and organic compounds to intermetallics with modulated structures. It is shown that three-dimensional ED is now as feasible as X-ray diffraction for phase identification and structure solution, but still needs further development in order to be as accurate as X-ray diffraction. It is expected that three

  16. Three-dimensional electron diffraction as a complementary technique to powder X-ray diffraction for phase identification and structure solution of powders.

    Science.gov (United States)

    Yun, Yifeng; Zou, Xiaodong; Hovmöller, Sven; Wan, Wei

    2015-03-01

    Phase identification and structure determination are important and widely used techniques in chemistry, physics and materials science. Recently, two methods for automated three-dimensional electron diffraction (ED) data collection, namely automated diffraction tomography (ADT) and rotation electron diffraction (RED), have been developed. Compared with X-ray diffraction (XRD) and two-dimensional zonal ED, three-dimensional ED methods have many advantages in identifying phases and determining unknown structures. Almost complete three-dimensional ED data can be collected using the ADT and RED methods. Since each ED pattern is usually measured off the zone axes by three-dimensional ED methods, dynamic effects are much reduced compared with zonal ED patterns. Data collection is easy and fast, and can start at any arbitrary orientation of the crystal, which facilitates automation. Three-dimensional ED is a powerful technique for structure identification and structure solution from individual nano- or micron-sized particles, while powder X-ray diffraction (PXRD) provides information from all phases present in a sample. ED suffers from dynamic scattering, while PXRD data are kinematic. Three-dimensional ED methods and PXRD are complementary and their combinations are promising for studying multiphase samples and complicated crystal structures. Here, two three-dimensional ED methods, ADT and RED, are described. Examples are given of combinations of three-dimensional ED methods and PXRD for phase identification and structure determination over a large number of different materials, from Ni-Se-O-Cl crystals, zeolites, germanates, metal-organic frameworks and organic compounds to intermetallics with modulated structures. It is shown that three-dimensional ED is now as feasible as X-ray diffraction for phase identification and structure solution, but still needs further development in order to be as accurate as X-ray diffraction. It is expected that three-dimensional ED methods

  17. Homogeneity characterisation of (U,Gd)O2 sintered pellets by X-ray diffraction powder analysis applying Rietveld method

    International Nuclear Information System (INIS)

    Leyva, Ana G.; Vega, Daniel R.; Trimarco, Veronica G.; Marchi, Daniel E.

    1999-01-01

    The (U,Gd)O 2 sintered pellets are fabricated by different methods. The homogeneity characterisation of Gd content seems to be necessary as a production control to qualify the process and the final product. The micrographic technique is the most common method used to analyse the homogeneity of these samples, this method requires time and expertise to obtain good results. In this paper, we propose an analysis of the X-ray diffraction powder patterns through the Rietveld method, in which the differences between the experimental data and the calculated from a crystalline structure model proposed are evaluated. This result allows to determine the cell parameters, that can be correlated with the Gd concentration, and the existence of other phases with different Gd ratio. (author)

  18. Analysis of synchrotron X-ray diffraction patterns from fluorotic enamel samples

    Energy Technology Data Exchange (ETDEWEB)

    Almeida, Ana P.G.; Braz, Delson, E-mail: anapaulagalmeida@gmail.co [Coordenacao dos Programas de Pos-graduacao de Engenharia (COPPE/UFRJ), Rio de Janeiro, RJ (Brazil). Lab. de Instrumentacao Nuclear; Colaco, Marcos V.; Barroso, Regina C., E-mail: cely@uerj.b [Universidade do Estado do Rio de Janeiro (UERJ), RJ (Brazil). Inst. de Fisica; Porto, Isabel M., E-mail: belporto@ig.com.b [Universidade Estadual de Campinas (UNICAMP), Piracicaba, SP (Brazil). Faculdade de Odontologia; Gerlach, Raquel F., E-mail: rfgerlach@forp.usp.b [Universidade de Sao Paulo (USP), Ribeirao Preto, SP (Brazil). Faculdade de Odontologia; Droppa Junior, Roosevelt, E-mail: rdroppa@lnls.b [Associacao Brasileira de Tecnologia de Luz Sincrotron (ABTLuS), Campinas, SP (Brazil)

    2009-07-01

    With the introduction of fluoride as the main anticaries agent used in preventive dentistry, and perhaps an increase in fluoride in our food chain, dental fluorosis has become an increasing world-wide problem. Visible signs of fluorosis begin to become obvious on the enamel surface as opacities, implying some porosity in the tissue. The mechanisms that conduct the formation of fluorotic enamel are unknown, but should involve modifications in the basics physical-chemistry reactions of demineralisation and remineralisation of the enamel of the teeth, which is the same reaction of formation of the enamel's hydroxyapatite (HAp) in the maturation phase. The increase of the amount of fluoride inside of the apatite will result in gradual increase of the lattice parameters. The hexagonal symmetry seems to work well with the powder diffraction data, and the crystal structure of HAp is usually described in space group P63/m. The aim of this work is to characterize the healthy and fluorotic enamel in human tooth using technique Synchrotron X-ray diffraction in order to determine the crystal structure and crystallinity of on fluoroapatite (FAp) crystal present in fluoritic enamel. All the scattering profile measurements was carried out at the X-ray diffraction beamline (XRD1) at the National Synchrotron Light Laboratory - LNLS, Campinas, Brazil. (author)

  19. Analysis of synchrotron X-ray diffraction patterns from fluorotic enamel samples

    International Nuclear Information System (INIS)

    Almeida, Ana P.G.; Braz, Delson

    2009-01-01

    With the introduction of fluoride as the main anticaries agent used in preventive dentistry, and perhaps an increase in fluoride in our food chain, dental fluorosis has become an increasing world-wide problem. Visible signs of fluorosis begin to become obvious on the enamel surface as opacities, implying some porosity in the tissue. The mechanisms that conduct the formation of fluorotic enamel are unknown, but should involve modifications in the basics physical-chemistry reactions of demineralisation and remineralisation of the enamel of the teeth, which is the same reaction of formation of the enamel's hydroxyapatite (HAp) in the maturation phase. The increase of the amount of fluoride inside of the apatite will result in gradual increase of the lattice parameters. The hexagonal symmetry seems to work well with the powder diffraction data, and the crystal structure of HAp is usually described in space group P63/m. The aim of this work is to characterize the healthy and fluorotic enamel in human tooth using technique Synchrotron X-ray diffraction in order to determine the crystal structure and crystallinity of on fluoroapatite (FAp) crystal present in fluoritic enamel. All the scattering profile measurements was carried out at the X-ray diffraction beamline (XRD1) at the National Synchrotron Light Laboratory - LNLS, Campinas, Brazil. (author)

  20. Simulations of X-ray diffraction of shock-compressed single-crystal tantalum with synchrotron undulator sources.

    Science.gov (United States)

    Tang, M X; Zhang, Y Y; E, J C; Luo, S N

    2018-05-01

    Polychromatic synchrotron undulator X-ray sources are useful for ultrafast single-crystal diffraction under shock compression. Here, simulations of X-ray diffraction of shock-compressed single-crystal tantalum with realistic undulator sources are reported, based on large-scale molecular dynamics simulations. Purely elastic deformation, elastic-plastic two-wave structure, and severe plastic deformation under different impact velocities are explored, as well as an edge release case. Transmission-mode diffraction simulations consider crystallographic orientation, loading direction, incident beam direction, X-ray spectrum bandwidth and realistic detector size. Diffraction patterns and reciprocal space nodes are obtained from atomic configurations for different loading (elastic and plastic) and detection conditions, and interpretation of the diffraction patterns is discussed.

  1. Simulations of X-ray diffraction of shock-compressed single-crystal tantalum with synchrotron undulator sources

    Energy Technology Data Exchange (ETDEWEB)

    Tang, M. X.; Zhang, Y. Y.; E, J. C.; Luo, S. N.

    2018-04-24

    Polychromatic synchrotron undulator X-ray sources are useful for ultrafast single-crystal diffraction under shock compression. Here, simulations of X-ray diffraction of shock-compressed single-crystal tantalum with realistic undulator sources are reported, based on large-scale molecular dynamics simulations. Purely elastic deformation, elastic–plastic two-wave structure, and severe plastic deformation under different impact velocities are explored, as well as an edge release case. Transmission-mode diffraction simulations consider crystallographic orientation, loading direction, incident beam direction, X-ray spectrum bandwidth and realistic detector size. Diffraction patterns and reciprocal space nodes are obtained from atomic configurations for different loading (elastic and plastic) and detection conditions, and interpretation of the diffraction patterns is discussed.

  2. Relativistic electron diffraction at the UCLA Pegasus photoinjector laboratory

    Energy Technology Data Exchange (ETDEWEB)

    Musumeci, P. [UCLA Department of Physics and Astronomy, 475 Portola Plaza, Los Angeles, CA 90095-1547 (United States)], E-mail: musumeci@physics.ucla.edu; Moody, J.T.; Scoby, C.M. [UCLA Department of Physics and Astronomy, 475 Portola Plaza, Los Angeles, CA 90095-1547 (United States)

    2008-10-15

    Electron diffraction holds the promise to yield real-time resolution of atomic motion in an easily accessible environment like a university laboratory at a fraction of the cost of fourth-generation X-ray sources. Currently the limit in time-resolution for conventional electron diffraction is set by how short an electron pulse can be made. A very promising solution to maintain the highest possible beam intensity without excessive pulse broadening from space charge effects is to increase the electron energy to the MeV level where relativistic effects significantly reduce the space charge forces. Rf photoinjectors can in principle deliver up to 10{sup 7}-10{sup 8} electrons packed in bunches of {approx}100-fs length, allowing an unprecedented time resolution and enabling the study of irreversible phenomena by single-shot diffraction patterns. The use of rf photoinjectors as sources for ultrafast electron diffraction has been recently at the center of various theoretical and experimental studies. The UCLA Pegasus laboratory, commissioned in early 2007 as an advanced photoinjector facility, is the only operating system in the country, which has recently demonstrated electron diffraction using a relativistic beam from an rf photoinjector. Due to the use of a state-of-the-art ultrashort photoinjector driver laser system, the beam has been measured to be sub-100-fs long, at least a factor of 5 better than what measured in previous relativistic electron diffraction setups. Moreover, diffraction patterns from various metal targets (titanium and aluminum) have been obtained using the Pegasus beam. One of the main laboratory goals in the near future is to fully develop the rf photoinjector-based ultrafast electron diffraction technique with particular attention to the optimization of the working point of the photoinjector in a low-charge ultrashort pulse regime, and to the development of suitable beam diagnostics.

  3. Relativistic electron diffraction at the UCLA Pegasus photoinjector laboratory

    International Nuclear Information System (INIS)

    Musumeci, P.; Moody, J.T.; Scoby, C.M.

    2008-01-01

    Electron diffraction holds the promise to yield real-time resolution of atomic motion in an easily accessible environment like a university laboratory at a fraction of the cost of fourth-generation X-ray sources. Currently the limit in time-resolution for conventional electron diffraction is set by how short an electron pulse can be made. A very promising solution to maintain the highest possible beam intensity without excessive pulse broadening from space charge effects is to increase the electron energy to the MeV level where relativistic effects significantly reduce the space charge forces. Rf photoinjectors can in principle deliver up to 10 7 -10 8 electrons packed in bunches of ∼100-fs length, allowing an unprecedented time resolution and enabling the study of irreversible phenomena by single-shot diffraction patterns. The use of rf photoinjectors as sources for ultrafast electron diffraction has been recently at the center of various theoretical and experimental studies. The UCLA Pegasus laboratory, commissioned in early 2007 as an advanced photoinjector facility, is the only operating system in the country, which has recently demonstrated electron diffraction using a relativistic beam from an rf photoinjector. Due to the use of a state-of-the-art ultrashort photoinjector driver laser system, the beam has been measured to be sub-100-fs long, at least a factor of 5 better than what measured in previous relativistic electron diffraction setups. Moreover, diffraction patterns from various metal targets (titanium and aluminum) have been obtained using the Pegasus beam. One of the main laboratory goals in the near future is to fully develop the rf photoinjector-based ultrafast electron diffraction technique with particular attention to the optimization of the working point of the photoinjector in a low-charge ultrashort pulse regime, and to the development of suitable beam diagnostics

  4. Relativistic electron diffraction at the UCLA Pegasus photoinjector laboratory.

    Science.gov (United States)

    Musumeci, P; Moody, J T; Scoby, C M

    2008-10-01

    Electron diffraction holds the promise to yield real-time resolution of atomic motion in an easily accessible environment like a university laboratory at a fraction of the cost of fourth-generation X-ray sources. Currently the limit in time-resolution for conventional electron diffraction is set by how short an electron pulse can be made. A very promising solution to maintain the highest possible beam intensity without excessive pulse broadening from space charge effects is to increase the electron energy to the MeV level where relativistic effects significantly reduce the space charge forces. Rf photoinjectors can in principle deliver up to 10(7)-10(8) electrons packed in bunches of approximately 100-fs length, allowing an unprecedented time resolution and enabling the study of irreversible phenomena by single-shot diffraction patterns. The use of rf photoinjectors as sources for ultrafast electron diffraction has been recently at the center of various theoretical and experimental studies. The UCLA Pegasus laboratory, commissioned in early 2007 as an advanced photoinjector facility, is the only operating system in the country, which has recently demonstrated electron diffraction using a relativistic beam from an rf photoinjector. Due to the use of a state-of-the-art ultrashort photoinjector driver laser system, the beam has been measured to be sub-100-fs long, at least a factor of 5 better than what measured in previous relativistic electron diffraction setups. Moreover, diffraction patterns from various metal targets (titanium and aluminum) have been obtained using the Pegasus beam. One of the main laboratory goals in the near future is to fully develop the rf photoinjector-based ultrafast electron diffraction technique with particular attention to the optimization of the working point of the photoinjector in a low-charge ultrashort pulse regime, and to the development of suitable beam diagnostics.

  5. Single photon energy dispersive x-ray diffraction

    International Nuclear Information System (INIS)

    Higginbotham, Andrew; Patel, Shamim; Ciricosta, Orlando; Suggit, Matthew J.; Wark, Justin S.; Hawreliak, James A.; Collins, Gilbert W.; Coppari, Federica; Eggert, Jon H.; Tang, Henry

    2014-01-01

    With the pressure range accessible to laser driven compression experiments on solid material rising rapidly, new challenges in the diagnosis of samples in harsh laser environments are emerging. When driving to TPa pressures (conditions highly relevant to planetary interiors), traditional x-ray diffraction techniques are plagued by increased sources of background and noise, as well as a potential reduction in signal. In this paper we present a new diffraction diagnostic designed to record x-ray diffraction in low signal-to-noise environments. By utilising single photon counting techniques we demonstrate the ability to record diffraction patterns on nanosecond timescales, and subsequently separate, photon-by-photon, signal from background. In doing this, we mitigate many of the issues surrounding the use of high intensity lasers to drive samples to extremes of pressure, allowing for structural information to be obtained in a regime which is currently largely unexplored

  6. Single photon energy dispersive x-ray diffraction

    Energy Technology Data Exchange (ETDEWEB)

    Higginbotham, Andrew; Patel, Shamim; Ciricosta, Orlando; Suggit, Matthew J.; Wark, Justin S. [Department of Physics, Clarendon Laboratory, University of Oxford, Parks Road, Oxford OX1 3PU (United Kingdom); Hawreliak, James A.; Collins, Gilbert W.; Coppari, Federica; Eggert, Jon H. [Lawrence Livermore National Laboratory, Livermore, California 94551 (United States); Tang, Henry [Department of Earth and Planetary Science, University of California Berkeley, Berkeley, California 94720 (United States)

    2014-03-15

    With the pressure range accessible to laser driven compression experiments on solid material rising rapidly, new challenges in the diagnosis of samples in harsh laser environments are emerging. When driving to TPa pressures (conditions highly relevant to planetary interiors), traditional x-ray diffraction techniques are plagued by increased sources of background and noise, as well as a potential reduction in signal. In this paper we present a new diffraction diagnostic designed to record x-ray diffraction in low signal-to-noise environments. By utilising single photon counting techniques we demonstrate the ability to record diffraction patterns on nanosecond timescales, and subsequently separate, photon-by-photon, signal from background. In doing this, we mitigate many of the issues surrounding the use of high intensity lasers to drive samples to extremes of pressure, allowing for structural information to be obtained in a regime which is currently largely unexplored.

  7. Neutron magnetic multiple diffraction in a natural magnetite crystal

    International Nuclear Information System (INIS)

    Mazzocchi, V.L.; Parente, C.B.R.

    1988-09-01

    Neutron multiple diffraction has been employed in the study of the magnetism in magnetite (Fe 3 O 4 ). Magnetite has a crystallographic structure of an inverted spinel with tetrahedral A sites occupied solely by trivalent Fe 3+ ions and octahedral B sites occupied both by divalent Fe 2+ ions and the remaining Fe 3+ ions in random distribution. At room temperature magnetite is a Neel A-B ferrimagnet where the ions on the A, B sites are coupled antiferromagneticaly. This coupling disappears at T sup c approx. or approx.= 580 0 C. Employing a natural single crystal of magnetite experimental neutron multiple diffraction patterns were obtained for the primary reflection 111 at room temperature and 703 0 C. This reflection is almost entirely magnetic in origin resulting in 'Aufhellung' patterns below T c and mixed 'Aufhellung-Umweganregung' patterns above T c . Theoretical patterns were calculated employing the iterative method for the approximation of intensities by a Taylor series and compared to the experimental results. (author) [pt

  8. AIC-based diffraction stacking for local earthquake locations at the Sumatran Fault (Indonesia)

    Science.gov (United States)

    Hendriyana, Andri; Bauer, Klaus; Muksin, Umar; Weber, Michael

    2018-05-01

    We present a new workflow for the localization of seismic events which is based on a diffraction stacking approach. In order to address the effects from complex source radiation patterns, we suggest to compute diffraction stacking from a characteristic function (CF) instead of stacking the original waveform data. A new CF, which is called in the following mAIC (modified from Akaike Information Criterion) is proposed. We demonstrate that both P- and S-wave onsets can be detected accurately. To avoid cross-talk between P and S waves due to inaccurate velocity models, we separate the P and S waves from the mAIC function by making use of polarization attributes. Then, the final image function is represented by the largest eigenvalue as a result of the covariance analysis between P- and S-image functions. Results from synthetic experiments show that the proposed diffraction stacking provides reliable results. The workflow of the diffraction stacking method was finally applied to local earthquake data from Sumatra, Indonesia. Recordings from a temporary network of 42 stations deployed for nine months around the Tarutung pull-apart basin were analysed. The seismic event locations resulting from the diffraction stacking method align along a segment of the Sumatran Fault. A more complex distribution of seismicity is imaged within and around the Tarutung basin. Two lineaments striking N-S were found in the centre of the Tarutung basin which support independent results from structural geology.

  9. Understanding deformation with high angular resolution electron backscatter diffraction (HR-EBSD)

    Science.gov (United States)

    Britton, T. B.; Hickey, J. L. R.

    2018-01-01

    High angular resolution electron backscatter diffraction (HR-EBSD) affords an increase in angular resolution, as compared to ‘conventional’ Hough transform based EBSD, of two orders of magnitude, enabling measurements of relative misorientations of 1 x 10-4 rads (~ 0.006°) and changes in (deviatoric) lattice strain with a precision of 1 x 10-4. This is achieved through direct comparison of two or more diffraction patterns using sophisticated cross-correlation based image analysis routines. Image shifts between zone axes in the two-correlated diffraction pattern are measured with sub-pixel precision and this realises the ability to measure changes in interplanar angles and lattice orientation with a high degree of sensitivity. These shifts are linked to strains and lattice rotations through simple geometry. In this manuscript, we outline the basis of the technique and two case studies that highlight its potential to tackle real materials science challenges, such as deformation patterning in polycrystalline alloys.

  10. Time-resolved Neutron Powder Diffraction

    International Nuclear Information System (INIS)

    Pannetier, J.

    1986-01-01

    The use of a high-flux neutron source together with a large position sensitive detector (PSD) allows a powder diffraction pattern to be recorded at a time-scale of a few minutes so that crystalline systems under non-equilibrium conditions may now conveniently be investigated. This introduces a new dimension into powder diffraction (the time and transient phenomena like heterogeneous chemical reactions can now be easily studied. The instrumental parameters relevant for the design of such time-dependent experiments are briefly surveyed and the current limits of the method are discussed. The applications are illustrated by two kinds of experiment in the field of inorganic solid state chemistry: true kinetic studies of heterogeneous chemical reactions and thermodiffractometry experiments

  11. High temperature neutron diffraction study of LaPO4

    International Nuclear Information System (INIS)

    Mishra, S.K.; Mittal, R.; Ningthoujam, R.S.; Vatsa, R.K.; Hansen, T.

    2016-01-01

    We report high temperature powder neutron diffractions study in LaPO 4 using high-flux D20 neutron diffractometer in the Institut Laue-Langevin, France. The measurements were carried out in high resolution mode (incident neutron wavelength 1.36 A) at various temperature upto 900°C. CarefuI inspection of temperature dependence of diffraction data showed appearance and disappearance of certain Bragg's reflections above 1273 K. It is a signature of structural phase transition. Rietveld refinement of the powder diffraction data revealed that diffraction patterns at and above 800°C could be indexed using the monoclinic structure with P21/n space group. Detail analysis for identify the water molecules is under investigation. (author)

  12. Light Diffraction by Large Amplitude Ultrasonic Waves in Liquids

    Science.gov (United States)

    Adler, Laszlo; Cantrell, John H.; Yost, William T.

    2016-01-01

    Light diffraction from ultrasound, which can be used to investigate nonlinear acoustic phenomena in liquids, is reported for wave amplitudes larger than that typically reported in the literature. Large amplitude waves result in waveform distortion due to the nonlinearity of the medium that generates harmonics and produces asymmetries in the light diffraction pattern. For standing waves with amplitudes above a threshold value, subharmonics are generated in addition to the harmonics and produce additional diffraction orders of the incident light. With increasing drive amplitude above the threshold a cascade of period-doubling subharmonics are generated, terminating in a region characterized by a random, incoherent (chaotic) diffraction pattern. To explain the experimental results a toy model is introduced, which is derived from traveling wave solutions of the nonlinear wave equation corresponding to the fundamental and second harmonic standing waves. The toy model reduces the nonlinear partial differential equation to a mathematically more tractable nonlinear ordinary differential equation. The model predicts the experimentally observed cascade of period-doubling subharmonics terminating in chaos that occurs with increasing drive amplitudes above the threshold value. The calculated threshold amplitude is consistent with the value estimated from the experimental data.

  13. Experimental technique of stress analyses by neutron diffraction

    International Nuclear Information System (INIS)

    Sun, Guangai; Chen, Bo; Huang, Chaoqiang

    2009-09-01

    The structures and main components of neutron diffraction stress analyses spectrometer, SALSA, as well as functions and parameters of each components are presented. The technical characteristic and structure parameters of SALSA are described. Based on these aspects, the choice of gauge volume, method of positioning sample, determination of diffraction plane and measurement of zero stress do are discussed. Combined with the practical experiments, the basic experimental measurement and the related settings are introduced, including the adjustments of components, pattern scattering, data recording and checking etc. The above can be an instruction for stress analyses experiments by neutron diffraction and neutron stress spectrometer construction. (authors)

  14. Axial channeling in electron diffraction

    International Nuclear Information System (INIS)

    Ichimiya, A.; Lehmpfuhl, G.

    1978-01-01

    Kossel patterns from Silicon and Niobium were obtained with a convergent electron beam. An intensity maximum in the direction of the zone axes [001] and [111] of Nb was interpreted as axial channeling. The intensity distribution in Kossel patterns was calculated by means of the Bloch wave picture of the dynamical theory of electron diffraction. Particularly zone axis patterns were calculated for different substance-energy combinations and they were compared with experimental observations. The intensity distribution in the calculated Kossel patterns was very sensitive to the model of absorption and it was found that a treatment of the absorption close to the model of Humphreys and Hirsch [Phil. Mag. 18, 115 (1968)] gave the best agreement with the experimental observations. Furthermore it is shown which Bloch waves are important for the intensity distribution in the Kossel patterns, how they are absorbed and how they change with energy. (orig.) [de

  15. Quantitative analysis of phases by x-ray diffraction and thermogravimetry in Cuban phosphorite ores

    International Nuclear Information System (INIS)

    Casanova Gomez, Abdel; Martinez Montalvo, Asor; Cilano Campos, Guillermo; Arostegui Aguirre, Miladys; Ferreiro Fernandez, Adalyz; Alonso Perez, Jose A.

    2016-01-01

    Phases analysis is performed by instrumental techniques X - ray diffraction and Thermal Analysis in two groups of samples of Cuban minerals carriers'phosphorus, candidates to reference materials. To this end, the variant of structural refinement of the diffraction pattern in the form of adjustment profile is applied, using the Full prof program of Juan Rodriguez-Carvajal. This analysis is the first step to develop the standard specification of these resources and classify them as phosphate rock and / or phospharite from their mass content. The statistical evaluation of the uncertainty of the quantitative analysis (standard deviation) was carried out in ten replicate samples of phosphate rock and eight of phosphate from the field Trinidad de Guedes. The qualitative phase analysis reflected the following phase composition: carbonate fluoroapatite (CFA), Calcite, Quartz and Halloysite (present only in the clayey granular phosphorite ore; FGA). By the method of setting pattern powder diffraction profile, the quantitative phase composition is reported in the sample FGA: 87 (2) % of CFA, 4 (1) % of Calcite, 1% Quartz, and 8 (3) % Halloysite. For granular limestone ore (FGC), the following contents were obtained: 87 (3) % Calcite, 8 (3) % of CFA and 5 (1) % Quartz: The obtained values are corroborated by Thermogravimetric Analysis (TG) through the calculation of the mass content of the thermally active phases (Calcite and CFA) in the range (27-10000 0 C), confirming the validity of the results of XRD. (Author)

  16. Application of modified analytical function for approximation and computer simulation of diffraction profile

    International Nuclear Information System (INIS)

    Marrero, S. I.; Turibus, S. N.; Assis, J. T. De; Monin, V. I.

    2011-01-01

    Data processing of the most of diffraction experiments is based on determination of diffraction line position and measurement of broadening of diffraction profile. High precision and digitalisation of these procedures can be resolved by approximation of experimental diffraction profiles by analytical functions. There are various functions for these purposes both simples, like Gauss function, but no suitable for wild range of experimental profiles and good approximating functions but complicated for practice using, like Vougt or PersonVII functions. Proposed analytical function is modified Cauchy function which uses two variable parameters allowing describing any experimental diffraction profile. In the presented paper modified function was applied for approximation of diffraction lines of steels after various physical and mechanical treatments and simulation of diffraction profiles applied for study of stress gradients and distortions of crystal structure. (Author)

  17. Nanostructure Diffraction Gratings for Integrated Spectroscopy and Sensing

    Science.gov (United States)

    Guo, Junpeng (Inventor)

    2016-01-01

    The present disclosure pertains to metal or dielectric nanostructures of the subwavelength scale within the grating lines of optical diffraction gratings. The nanostructures have surface plasmon resonances or non-plasmon optical resonances. A linear photodetector array is used to capture the resonance spectra from one of the diffraction orders. The combined nanostructure super-grating and photodetector array eliminates the use of external optical spectrometers for measuring surface plasmon or optical resonance frequency shift caused by the presence of chemical and biological agents. The nanostructure super-gratings can be used for building integrated surface enhanced Raman scattering (SERS) spectrometers. The nanostructures within the diffraction grating lines enhance Raman scattering signal light while the diffraction grating pattern of the nanostructures diffracts Raman scattering light to different directions of propagation according to their wavelengths. Therefore, the nanostructure super-gratings allows for the use of a photodetector array to capture the surface enhanced Raman scattering spectra.

  18. Applying and Developing Patterns in Teaching

    DEFF Research Database (Denmark)

    Bennedsen, Jens; Eriksen, Ole

    2003-01-01

    A community of teachers and researchers within computer science has adopted the idea of patterns and developed a set of pedagogical patterns. These patterns capture best practices in teaching. From our research and teaching practice we have observed that pedagogical patterns are useful...... enriches the notion of pedagogical patterns. Inspired by conditions for learning we identify three values in teaching in the field of engineering-related educations. Further we present a value-based template for guidelines in teaching, causing a better understanding of the patterns and help teachers...

  19. X-ray diffraction microtomography using synchrotron radiation

    CERN Document Server

    Barroso, R C; Jesus, E F O; Oliveira, L F

    2001-01-01

    The X-ray diffraction computed tomography technique is based on the interference phenomena of the coherent scatter. For low-momentum transfer, it is most probable that the scattering interaction will be coherent. A selective discrimination of a given element in a scanned specimen can be realized by fixing the Bragg angle which produces an interference peak and then, to carry out the computed tomography in the standard mode. The image reconstructed exalts the presence of this element with respect to other ones in a sample. This work reports the feasibility of a non-destructive synchrotron radiation X-ray diffraction imaging technique. This research was performed at the X-ray Diffraction beam line of the National Synchrotron Light Laboratory (LNLS) in Brazil. The coherent scattering properties of different tissue and bone substitute materials were evaluated. Furthermore, diffraction patterns of some polycrystalline solids were studied due to industrial and environmental human exposure to these metals. The obtai...

  20. Emergent rotational symmetries in disordered magnetic domain patterns.

    Science.gov (United States)

    Su, Run; Seu, Keoki A; Parks, Daniel; Kan, Jimmy J; Fullerton, Eric E; Roy, Sujoy; Kevan, Stephen D

    2011-12-16

    Uniaxial systems often form labyrinthine domains that exhibit short-range order but are macroscopically isotropic and would not be expected to exhibit precise symmetries. However, their underlying frustration results in a multitude of metastable configurations of comparable energy, and driving such a system externally might lead to pattern formation. We find that soft x-ray speckle diffraction patterns of the labyrinthine domains in CoPd/IrMn heterostructures reveal a diverse array of hidden rotational symmetries about the magnetization axis, thereby suggesting an unusual form of emergent order in an otherwise disordered system. These symmetries depend on applied magnetic field, magnetization history, and scattering wave vector. Maps of rotational symmetry exhibit intriguing structures that can be controlled by manipulating the applied magnetic field in concert with the exchange bias condition. © 2011 American Physical Society

  1. Diffractive flat panel solar concentrators of a novel design

    NARCIS (Netherlands)

    De Jong, T.M.; de Boer, D.K.G.; Bastiaansen, C.W.M.

    2016-01-01

    A novel design for a flat panel solar concentrator is presented which is based on a light guide with a grating applied on top that diffracts light into total internal reflection. By combining geometrical and diffractive optics the geometrical concentration ratio is optimized according to the

  2. A pseudospectral collocation time-domain method for diffractive optics

    DEFF Research Database (Denmark)

    Dinesen, P.G.; Hesthaven, J.S.; Lynov, Jens-Peter

    2000-01-01

    We present a pseudospectral method for the analysis of diffractive optical elements. The method computes a direct time-domain solution of Maxwell's equations and is applied to solving wave propagation in 2D diffractive optical elements. (C) 2000 IMACS. Published by Elsevier Science B.V. All rights...

  3. Nanocrystallite characterization of milled simulated dry process fuel powders by neutron diffraction

    International Nuclear Information System (INIS)

    Ryu, Ho Jin; Kang, Kwon Ho; Moon, Je Sun; Song, Kee Chan; Choi, Yong Nam

    2003-01-01

    The nano-scale crystallite sizes of simulated spent fuel powders were measured by the neutron diffraction line broadening method in order to analyze the sintering behavior of the dry process fuel. The mixed U0 2 and fission product oxide powders were dry-milled in an attritor for 30, 60, and 120 min. The diffraction patterns of the powders were obtained by using the high resolution powder diffractometer in the HANARO research reactor. Diffraction line broadening due to crystallite size was measured using various techniques such as the Stokes' deconvolution, profile fitting methods using Cauchy function, Gaussian function, and Voigt function, and the Warren-Averbach method. The r.m.s. strain, stacking fault, twin and dislocation density were measured using the information from the diffraction pattern. The realistic crystallite size can be obtained after separation of the contribution from the non-uniform strain, stacking fault and twin

  4. Strain fields in crystalline solids: prediction and measurement of X- ray diffraction patterns and electron diffraction contrast images

    NARCIS (Netherlands)

    Bor, Teunis Cornelis

    2000-01-01

    Lattice imperfections, such as dislocations and misfitting particles, shift and/or broaden X-ray diffraction (XRD) line profiles. Most of the present analysis methods of the shift and broadening of XRD line profiles do not provide the characteristics of lattice imperfections. The main part of this

  5. Atomic-layer-resolved analysis of surface magnetism by diffraction spectroscopy

    International Nuclear Information System (INIS)

    Matsui, Fumihiko; Matsushita, Tomohiro; Daimon, Hiroshi

    2010-01-01

    X-ray absorption near edge structure (XANES) and X-ray magnetic circular dichroism (XMCD) measurements by Auger-electron-yield detection are powerful analysis tools for the electronic and magnetic structures of surfaces, but all the information from atoms within the electron mean-free-path range is summed into the obtained spectrum. In order to investigate the electronic and magnetic structures of each atomic layer at subsurface, we have proposed a new method, diffraction spectroscopy, which is the combination of X-ray absorption spectroscopy and Auger electron diffraction (AED). From a series of measured thickness dependent AED patterns, we deduced a set of atomic-layer-specific AED patterns arithmetically. Based on these AED patterns, we succeeded in disentangling obtained XANES and XMCD spectra into those from different atomic layers.

  6. Ultrafast coherent diffractive imaging of nanoparticles using X-ray free-electron laser radiation

    International Nuclear Information System (INIS)

    Kassemeyer, Stephan

    2014-01-01

    Coherent diffractive imaging with X-ray free-electron lasers (X-FEL) promises high-resolution structure determination of single microscopic particles without the need for crystallization. The diffraction signal of small samples can be very weak, a difficulty that can not be countered by merely increasing the number of photons because the sample would be damaged by a high absorbed radiation dose. Traditional X-ray crystallography avoids this problem by bringing many sample particles into a periodic arrangement, which amplifies the individual signals while distributing the absorbed dose. Depending on the sample, however, crystallization can be very difficult or even impossible. This thesis presents algorithms for a new imaging approach using X-FEL radiation that works with single, non-crystalline sample particles. X-FELs can deliver X-rays with a peak brilliance many orders of magnitude higher than conventional X-ray sources, compensating for their weak interaction cross sections. At the same time, FELs can produce ultra-short pulses down to a few femtoseconds. In this way it is possible to perform ultra-fast imaging, essentially ''freezing'' the atomic positions in time and terminating the imaging process before the sample is destroyed by the absorbed radiation. This thesis primarily focuses on the three-dimensional reconstruction of single (and not necessarily crystalline) particles using coherent diffractive imaging at X-FELs: in order to extract three-dimensional information from scattering data, two-dimensional diffraction patterns from many different viewing angles must be combined. Therefore, the diffraction signal of many identical sample copies in random orientations is measured. The main result of this work is a globally optimal algorithm that can recover the sample orientations solely based on the diffraction signal, enabling three-dimensional imaging for arbitrary samples. The problem of finding three-dimensional orientations is

  7. Interpretation of small-angle diffraction experiments on opal-like photonic crystals

    Science.gov (United States)

    Marlow, F.; Muldarisnur, M.; Sharifi, P.; Zabel, H.

    2011-08-01

    Comprehensive structural information on artificial opals involving the deviations from the strongly dominating face-centered cubic structure is still missing. Recent structure investigations with neutrons and synchrotron sources have shown a high degree of order but also a number of unexpected scattering features. Here, we point out that the exclusion of the allowed 002-type diffraction peaks by a small atomic form factor is not obvious and that surface scattering has to be included as a possible source for the diffraction peaks. Our neutron diffraction data indicate that surface scattering is the main reason for the smallest-angle peaks in the diffraction patterns.

  8. Photoelectron diffraction k-space volumes of the c(2x2) Mn/Ni(100) structure

    Energy Technology Data Exchange (ETDEWEB)

    Banerjee, S.; Denlinger, J.; Chen, X. [Univ. of Wisconsin, Milwaukee, WI (United States)] [and others

    1997-04-01

    Traditionally, x-ray photoelectron diffraction (XPD) studies have either been done by scanning the diffraction angle for fixed kinetic energy (ADPD), or scanning the kinetic energy at fixed exit angle (EDPD). Both of these methods collect subsets of the full diffraction pattern, or volume, which is the intensity of photoemission as a function of momentum direction and magnitude. With the high density available at the Spectromicroscopy Facility (BL 7.0) {open_quotes}ultraESCA{close_quotes} station, the authors are able to completely characterize the photoelectron diffraction patterns of surface structures, up to several hundred electron volts kinetic energy. This large diffraction `volume` can then be analyzed in many ways. The k-space volume contains as a subset the energy dependent photoelectron diffraction spectra along all emission angles. It also contains individual, hemispherical, diffraction patterns at specific kinetic energies. Other `cuts` through the data set are also possible, revealing new ways of viewing photoelectron diffraction data, and potentially new information about the surface structure being studied. In this article the authors report a brief summary of a structural study being done on the c(2x2) Mn/Ni(100) surface alloy. This system is interesting for both structural and magnetic reasons. Magnetically, the Mn/Ni(100) surface alloy exhibits parallel coupling of the Mn and Ni moments, which is opposite to the reported coupling for the bulk, disordered, alloy. Structurally, the Mn atoms are believed to lie well above the surface plane.

  9. Suppressing Ghost Diffraction in E-Beam-Written Gratings

    Science.gov (United States)

    Wilson, Daniel; Backlund, Johan

    2009-01-01

    A modified scheme for electron-beam (E-beam) writing used in the fabrication of convex or concave diffraction gratings makes it possible to suppress the ghost diffraction heretofore exhibited by such gratings. Ghost diffraction is a spurious component of diffraction caused by a spurious component of grating periodicity as described below. The ghost diffraction orders appear between the main diffraction orders and are typically more intense than is the diffuse scattering from the grating. At such high intensity, ghost diffraction is the dominant source of degradation of grating performance. The pattern of a convex or concave grating is established by electron-beam writing in a resist material coating a substrate that has the desired convex or concave shape. Unfortunately, as a result of the characteristics of electrostatic deflectors used to control the electron beam, it is possible to expose only a small field - typically between 0.5 and 1.0 mm wide - at a given fixed position of the electron gun relative to the substrate. To make a grating larger than the field size, it is necessary to move the substrate to make it possible to write fields centered at different positions, so that the larger area is synthesized by "stitching" the exposed fields.

  10. Design and fabrication of diffractive optical elements with MATLAB

    National Research Council Canada - National Science Library

    Bhattacharya, Shanti (Professor in Optics); Vijayakumar, Anand

    2017-01-01

    ... their diffraction patterns using MATLAB. The fundamentals of fabrication techniques such as photolithography, electron beam lithography, and focused ion beam lithography with basic instructions for the beginner are presented...

  11. Crystallite Size and Microstrain Measurement of Cathode Material after Mechanical Milling using Neutron Diffraction Technique

    Directory of Open Access Journals (Sweden)

    A. Fajar

    2010-12-01

    Full Text Available The measurements of neutron diffraction patterns of commercially product and 10 hour mechanically milled cathode material lithium cobaltites (LiCoO2 have been performed. Rietveld analysis using FullProf does not show the change of crystal structure due to milling process, but the diffraction pattern has a lower intensity and the diffraction-line was broadening. The results of line-broadening study on milled sample using Rietveld methods detected that the microstrain was occurred in the sample with value 0.127080(35 % and the average crystallite size was 424.78(20 Å.

  12. Structure of lamellar lipid domains and corneocyte envelopes of murine stratum corneum. An X-ray diffraction study

    International Nuclear Information System (INIS)

    White, S.H.; Mirejovsky, D.; King, G.I.

    1988-01-01

    The lipid of the outermost layer of the skin is confined largely to the extracellular spaces surrounding the corneocytes of the stratum corneum where it forms a multilamellar adhesive matrix to act as the major permeability barrier of the skin. Knowledge of the molecular architecture of these intercellular domains is important for understanding various skin pathologies and their treatment, percutaneous drug delivery, and the cosmetic maintenance of the skin. The authors have surveyed by X-ray diffraction the structure of the intercellular domains and the extracted lipids of murine stratum corneum (SC) at 25, 45, and 70 0 C which are temperatures in the vicinity of known thermal phase transitions. The intercellular domains produce lamellar diffraction patterns with a Bragg spacing of 131 +/- 2 A. Lipid extracted from the SC and dispersed in excess water does not produce a simple lamellar diffraction pattern at any temperature studied, however. This and other facts suggest that another component, probably a protein, must be present to control the architecture of the intercellular lipid domains. They have also obtained diffraction patterns attributable to the protein envelopes of the corneocytes. The patterns suggest a β-pleated sheet organizational scheme. No diffraction patterns were observed that could be attributed to keratin

  13. Pattern recognition applied to infrared images for early alerts in fog

    Science.gov (United States)

    Boucher, Vincent; Marchetti, Mario; Dumoulin, Jean; Cord, Aurélien

    2014-09-01

    Fog conditions are the cause of severe car accidents in western countries because of the poor induced visibility. Its forecast and intensity are still very difficult to predict by weather services. Infrared cameras allow to detect and to identify objects in fog while visibility is too low for eye detection. Over the past years, the implementation of cost effective infrared cameras on some vehicles has enabled such detection. On the other hand pattern recognition algorithms based on Canny filters and Hough transformation are a common tool applied to images. Based on these facts, a joint research program between IFSTTAR and Cerema has been developed to study the benefit of infrared images obtained in a fog tunnel during its natural dissipation. Pattern recognition algorithms have been applied, specifically on road signs which shape is usually associated to a specific meaning (circular for a speed limit, triangle for an alert, …). It has been shown that road signs were detected early enough in images, with respect to images in the visible spectrum, to trigger useful alerts for Advanced Driver Assistance Systems.

  14. Reconstructing an icosahedral virus from single-particle diffraction experiments

    Science.gov (United States)

    Saldin, D. K.; Poon, H.-C.; Schwander, P.; Uddin, M.; Schmidt, M.

    2011-08-01

    The first experimental data from single-particle scattering experiments from free electron lasers (FELs) are now becoming available. The first such experiments are being performed on relatively large objects such as viruses, which produce relatively low-resolution, low-noise diffraction patterns in so-called ``diffract-and-destroy'' experiments. We describe a very simple test on the angular correlations of measured diffraction data to determine if the scattering is from an icosahedral particle. If this is confirmed, the efficient algorithm proposed can then combine diffraction data from multiple shots of particles in random unknown orientations to generate a full 3D image of the icosahedral particle. We demonstrate this with a simulation for the satellite tobacco necrosis virus (STNV), the atomic coordinates of whose asymmetric unit is given in Protein Data Bank entry 2BUK.

  15. X-ray diffraction patterns of thermally-reduced graphenes

    International Nuclear Information System (INIS)

    Ju, Hae-Mi; Choi, Sung-Ho; Huh, Seung-Hun

    2010-01-01

    Thermally-reduced graphenes (GPs) from graphene oxides (GOs) in the range of 200 - 800 .deg. C have been investigated by using X-ray diffraction (XRD). The temperature-dependent evolutions of the (002) peaks show that exfoliation of GO sheets occurs, along with wrinkling, at ∼200 .deg. C and that high-quality GPs are produced at ∼ 600 .deg. C (GP 600 ). These phenomena are explained by the vaporization of intercalated water molecules and the effective removal of the oxide groups of GO by thermal annealing, respectively. GP 600 exhibited a clean and sharp (002) peak corresponding to an interlayer distance of 3.392 A, which is close to that of conventional graphene (∼3.4 A). The structure of GP 600 is further discussed.

  16. Generalized Phase contrast and matched filtering for speckle‐free patterned illumination

    DEFF Research Database (Denmark)

    Palima, Darwin; Bañas, Andrew Rafael; Villangca, Mark Jayson

    2013-01-01

    Generalized Phase Contrast (GPC) and matched‐filtering GPC use tandem diffractive phase elements on Fourier‐conjugate planes of a 4f optical processor to efficiently reshape incident light into a pattern that resembles the input phase modulation pattern. The synthesized patterns are inherently...... to optically trap and mechanically manipulate microparticles, GPC has also been applied for laser beamshaping, optical phase cryptography, and greyscale image projection. Recent reports from our collaborators highlight that GPC‐based spatial lightshaping, when combined with temporal focusing and multiphoton...... excitation, exhibits some robustness against light scattering and, hence, makes a promising tool for spatially precise targeting of deeper subsurface neurons using minimally speckled patterned illumination for multiphoton excitation....

  17. Diffractive generalized phase contrast for adaptive phase imaging and optical security

    DEFF Research Database (Denmark)

    Palima, Darwin; Glückstad, Jesper

    2012-01-01

    We analyze the properties of Generalized Phase Contrast (GPC) when the input phase modulation is implemented using diffractive gratings. In GPC applications for patterned illumination, the use of a dynamic diffractive optical element for encoding the GPC input phase allows for onthe- fly optimiza...... security applications and can be used to create phasebased information channels for enhanced information security....

  18. X-Ray Diffraction and the Discovery of the Structure of DNA

    Science.gov (United States)

    Crouse, David T.

    2007-01-01

    A method is described for teaching the analysis of X-ray diffraction of DNA through a series of steps utilizing the original methods used by James Watson, Francis Crick, Maurice Wilkins and Rosalind Franklin. The X-ray diffraction pattern led to the conclusion of the basic helical structure of DNA and its dimensions while basic chemical principles…

  19. Diamond-anvil cell for radial x-ray diffraction

    International Nuclear Information System (INIS)

    Chesnut, G N; Schiferl, D; Streetman, B D; Anderson, W W

    2006-01-01

    We have designed a new diamond-anvil cell capable of radial x-ray diffraction to pressures of a few hundred GPa. The diffraction geometry allows access to multiple angles of Ψ, which is the angle between each reciprocal lattice vector g(hkl) and the compression axis of the cell. At the 'magic angle', Ψ∼54.7 0 , the effects of deviatoric stresses on the interplanar spacings, d(hkl), are significantly reduced. Because the systematic errors, which are different for each d(hkl), are significantly reduced, the crystal structures and the derived equations of state can be determined reliably. At other values of Ψ, the effects of deviatoric stresses on the diffraction pattern could eventually be used to determine elastic constants

  20. Automated grain mapping using wide angle convergent beam electron diffraction in transmission electron microscope for nanomaterials.

    Science.gov (United States)

    Kumar, Vineet

    2011-12-01

    The grain size statistics, commonly derived from the grain map of a material sample, are important microstructure characteristics that greatly influence its properties. The grain map for nanomaterials is usually obtained manually by visual inspection of the transmission electron microscope (TEM) micrographs because automated methods do not perform satisfactorily. While the visual inspection method provides reliable results, it is a labor intensive process and is often prone to human errors. In this article, an automated grain mapping method is developed using TEM diffraction patterns. The presented method uses wide angle convergent beam diffraction in the TEM. The automated technique was applied on a platinum thin film sample to obtain the grain map and subsequently derive grain size statistics from it. The grain size statistics obtained with the automated method were found in good agreement with the visual inspection method.

  1. Continuous firefly algorithm applied to PWR core pattern enhancement

    International Nuclear Information System (INIS)

    Poursalehi, N.; Zolfaghari, A.; Minuchehr, A.; Moghaddam, H.K.

    2013-01-01

    Highlights: ► Numerical results indicate the reliability of CFA for the nuclear reactor LPO. ► The major advantages of CFA are its light computational cost and fast convergence. ► Our experiments demonstrate the ability of CFA to obtain the near optimal loading pattern. -- Abstract: In this research, the new meta-heuristic optimization strategy, firefly algorithm, is developed for the nuclear reactor loading pattern optimization problem. Two main goals in reactor core fuel management optimization are maximizing the core multiplication factor (K eff ) in order to extract the maximum cycle energy and minimizing the power peaking factor due to safety constraints. In this work, we define a multi-objective fitness function according to above goals for the core fuel arrangement enhancement. In order to evaluate and demonstrate the ability of continuous firefly algorithm (CFA) to find the near optimal loading pattern, we developed CFA nodal expansion code (CFANEC) for the fuel management operation. This code consists of two main modules including CFA optimization program and a developed core analysis code implementing nodal expansion method to calculate with coarse meshes by dimensions of fuel assemblies. At first, CFA is applied for the Foxholes test case with continuous variables in order to validate CFA and then for KWU PWR using a decoding strategy for discrete variables. Results indicate the efficiency and relatively fast convergence of CFA in obtaining near optimal loading pattern with respect to considered fitness function. At last, our experience with the CFA confirms that the CFA is easy to implement and reliable

  2. Continuous firefly algorithm applied to PWR core pattern enhancement

    Energy Technology Data Exchange (ETDEWEB)

    Poursalehi, N., E-mail: npsalehi@yahoo.com [Engineering Department, Shahid Beheshti University, G.C., P.O. Box 1983963113, Tehran (Iran, Islamic Republic of); Zolfaghari, A.; Minuchehr, A.; Moghaddam, H.K. [Engineering Department, Shahid Beheshti University, G.C., P.O. Box 1983963113, Tehran (Iran, Islamic Republic of)

    2013-05-15

    Highlights: ► Numerical results indicate the reliability of CFA for the nuclear reactor LPO. ► The major advantages of CFA are its light computational cost and fast convergence. ► Our experiments demonstrate the ability of CFA to obtain the near optimal loading pattern. -- Abstract: In this research, the new meta-heuristic optimization strategy, firefly algorithm, is developed for the nuclear reactor loading pattern optimization problem. Two main goals in reactor core fuel management optimization are maximizing the core multiplication factor (K{sub eff}) in order to extract the maximum cycle energy and minimizing the power peaking factor due to safety constraints. In this work, we define a multi-objective fitness function according to above goals for the core fuel arrangement enhancement. In order to evaluate and demonstrate the ability of continuous firefly algorithm (CFA) to find the near optimal loading pattern, we developed CFA nodal expansion code (CFANEC) for the fuel management operation. This code consists of two main modules including CFA optimization program and a developed core analysis code implementing nodal expansion method to calculate with coarse meshes by dimensions of fuel assemblies. At first, CFA is applied for the Foxholes test case with continuous variables in order to validate CFA and then for KWU PWR using a decoding strategy for discrete variables. Results indicate the efficiency and relatively fast convergence of CFA in obtaining near optimal loading pattern with respect to considered fitness function. At last, our experience with the CFA confirms that the CFA is easy to implement and reliable.

  3. Elucidating structural order and disorder phenomena in mullite-type Al4B2O9 by automated electron diffraction tomography

    International Nuclear Information System (INIS)

    Zhao, Haishuang; Krysiak, Yaşar; Hoffmann, Kristin; Barton, Bastian; Molina-Luna, Leopoldo; Neder, Reinhard B.; Kleebe, Hans-Joachim; Gesing, Thorsten M.; Schneider, Hartmut; Fischer, Reinhard X.

    2017-01-01

    The crystal structure and disorder phenomena of Al 4 B 2 O 9 , an aluminum borate from the mullite-type family, were studied using automated diffraction tomography (ADT), a recently established method for collection and analysis of electron diffraction data. Al 4 B 2 O 9 , prepared by sol-gel approach, crystallizes in the monoclinic space group C2/m. The ab initio structure determination based on three-dimensional electron diffraction data from single ordered crystals reveals that edge-connected AlO 6 octahedra expanding along the b axis constitute the backbone. The ordered structure (A) was confirmed by TEM and HAADF-STEM images. Furthermore, disordered crystals with diffuse scattering along the b axis are observed. Analysis of the modulation pattern implies a mean superstructure (AAB) with a threefold b axis, where B corresponds to an A layer shifted by ½a and ½c. Diffraction patterns simulated for the AAB sequence including additional stacking disorder are in good agreement with experimental electron diffraction patterns. - Graphical abstract: Crystal structure and disorder phenomena of B-rich Al 4 B 2 O 9 studied by automated electron diffraction tomography (ADT) and described by diffraction simulation using DISCUS. - Highlights: • Ab-initio structure solution by electron diffraction from single nanocrystals. • Detected modulation corresponding mainly to three-fold superstructure. • Diffuse diffraction streaks caused by stacking faults in disordered crystals. • Observed streaks explained by simulated electron diffraction patterns.

  4. Foucault imaging and small-angle electron diffraction in controlled external magnetic fields.

    Science.gov (United States)

    Nakajima, Hiroshi; Kotani, Atsuhiro; Harada, Ken; Ishii, Yui; Mori, Shigeo

    2016-12-01

    We report a method for acquiring Foucault images and small-angle electron diffraction patterns in external magnetic fields using a conventional transmission electron microscope without any modification. In the electron optical system that we have constructed, external magnetic fields parallel to the optical axis can be controlled using the objective lens pole piece under weak excitation conditions in the Foucault mode and the diffraction mode. We observe two ferromagnetic perovskite-type manganese oxides, La 0.7 Sr 0.3 MnO 3 (LSMO) and Nd 0.5 Sr 0.5 MnO 3 , in order to visualize magnetic domains and their magnetic responses to external magnetic fields. In rhombohedral-structured LSMO, pinning of magnetic domain walls at crystallographic twin boundaries was found to have a strong influence on the generation of new magnetic domains in external applied magnetic fields. © The Author 2016. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oup.com.

  5. A general method for baseline-removal in ultrafast electron powder diffraction data using the dual-tree complex wavelet transform

    Directory of Open Access Journals (Sweden)

    Laurent P. René de Cotret

    2017-07-01

    Full Text Available The general problem of background subtraction in ultrafast electron powder diffraction (UEPD is presented with a focus on the diffraction patterns obtained from materials of moderately complex structure which contain many overlapping peaks and effectively no scattering vector regions that can be considered exclusively background. We compare the performance of background subtraction algorithms based on discrete and dual-tree complex (DTCWT wavelet transforms when applied to simulated UEPD data on the M1–R phase transition in VO2 with a time-varying background. We find that the DTCWT approach is capable of extracting intensities that are accurate to better than 2% across the whole range of scattering vector simulated, effectively independent of delay time. A Python package is available.

  6. ENDIX. A computer program to simulate energy dispersive X-ray and synchrotron powder diffraction diagrams

    International Nuclear Information System (INIS)

    Hovestreydt, E.; Karlsruhe Univ.; Parthe, E.; Benedict, U.

    1987-01-01

    A Fortran 77 computer program is described which allows the simulation of energy dispersive X-ray and synchrotron powder diffraction diagrams. The input consists of structural data (space group, unit cell dimensions, atomic positional and displacement parameters) and information on the experimental conditions (chosen Bragg angle, type of X-ray tube and applied voltage or operating power of synchrotron radiation source). The output consists of the normalized intensities of the diffraction lines, listed by increasing energy (in keV), and of an optional intensity-energy plot. The intensities are calculated with due consideration of the wave-length dependence of both the anomalous dispersion and the absorption coefficients. For a better agreement between observed and calculated spectra provision is made to optionally superimpose, on the calculated diffraction line spectrum, all additional lines such as fluorescence and emission lines and escape peaks. The different effects which have been considered in the simulation are discussed in some detail. A sample calculation of the energy dispersive powder diffraction pattern of UPt 3 (Ni 3 Sn structure type) is given. Warning: the user of ENDIX should be aware that for a successful application it is necessary to adapt the program to correspond to the actual experimental conditions. Even then, due to the only approximately known values of certain functions, the agreement between observed and calculated intensities will not be as good as for angle dispersive diffraction methods

  7. Slow scan sit detector for x-ray diffraction studies using synchrotron radiation

    International Nuclear Information System (INIS)

    Milch, J.R.

    1978-01-01

    A TV-type x-ray detector using a SIT vidicon has been used for biological diffraction studies at the EMBL outstation at DESY, Hamburg, Germany. The detector converts the two-dimensional diffraction pattern to a charge pattern on the vidicon target, which is read out in the slow-scan mode. This detector has high DOE, no count-rate limit, and is simple and inexpensive to construct. Radiation from the storage ring DORIS was used to study the structure of live muscle at various phases of contraction. Typically the count-rate on the detector was 10 6 x-rays/sec and a total exposure of a few seconds was needed to record the weak diffraction from muscle. This compares with usual exposure times of several hours using a rotating anode generator and film

  8. Fourier diffraction theorem for diffusion-based thermal tomography

    International Nuclear Information System (INIS)

    Baddour, Natalie

    2006-01-01

    There has been much recent interest in thermal imaging as a method of non-destructive testing and for non-invasive medical imaging. The basic idea of applying heat or cold to an area and observing the resulting temperature change with an infrared camera has led to the development of rapid and relatively inexpensive inspection systems. However, the main drawback to date has been that such an approach provides mainly qualitative results. In order to advance the quantitative results that are possible via thermal imaging, there is interest in applying techniques and algorithms from conventional tomography. Many tomography algorithms are based on the Fourier diffraction theorem, which is inapplicable to thermal imaging without suitable modification to account for the attenuative nature of thermal waves. In this paper, the Fourier diffraction theorem for thermal tomography is derived and discussed. The intent is for this thermal-diffusion based Fourier diffraction theorem to form the basis of tomographic reconstruction algorithms for quantitative thermal imaging

  9. Computer programs for unit-cell determination in electron diffraction experiments

    International Nuclear Information System (INIS)

    Li, X.Z.

    2005-01-01

    A set of computer programs for unit-cell determination from an electron diffraction tilt series and pattern indexing has been developed on the basis of several well-established algorithms. In this approach, a reduced direct primitive cell is first determined from experimental data, in the means time, the measurement errors of the tilt angles are checked and minimized. The derived primitive cell is then checked for possible higher lattice symmetry and transformed into a proper conventional cell. Finally a least-squares refinement procedure is adopted to generate optimum lattice parameters on the basis of the lengths of basic reflections in each diffraction pattern and the indices of these reflections. Examples are given to show the usage of the programs

  10. In-situ X-ray diffraction : a useful tool to investigate hydride-formation reactions

    NARCIS (Netherlands)

    Notten, P.H.L.; Daams, J.L.C.; Veirman, de A.E.M.; Staals, A.A.

    1994-01-01

    A high-pressure X-ray diffraction (XRD) cell has been designed which allowed us to study simultaneously hydrogen absorption/desorption isotherms and XRD powder diffraction patterns on (de)hydrided intermetallic compounds. The hydride formation reaction was investigated in the case of LaNi5 under

  11. Diffraction-amalgamated grain boundary tracking for mapping 3D crystallographic orientation and strain fields during plastic deformation

    International Nuclear Information System (INIS)

    Toda, Hiroyuki; Kamiko, Takanobu; Tanabe, Yasuto; Kobayashi, Masakazu; Leclere, D.J.; Uesugi, Kentaro; Takeuchi, Akihisa; Hirayama, Kyosuke

    2016-01-01

    By amalgamating the X-ray diffraction technique with the grain boundary tracking technique, a novel method, diffraction-amalgamated grain boundary tracking (DAGT), has been developed. DAGT is a non-destructive in-situ analysis technique for characterising bulk materials, which can be applied up to near the point of fracture. It provides information about local crystal orientations and detailed grain morphologies in three dimensions, together with high-density strain mapping inside grains. As it obtains the grain morphologies by utilising X-ray imaging instead of X-ray diffraction, which latter is typically vulnerable to plastic deformation, DAGT is a fairly robust technique for analysing plastically deforming materials. Texture evolution and localised deformation behaviours have here been successfully characterised in Al–Cu alloys, during tensile deformation of 27% in applied strain. The characteristic rotation behaviours of grains were identified, and attributed to the effects of interaction with adjacent grains on the basis of the 3D local orientation and plastic strain distributions. It has also been revealed that 3D strain distribution in grains is highly heterogeneous, which is not explained by known mechanisms such as simple incompatibility with adjacent grains or strain percolation through soft grains. It has been clarified that groups consisting of a few adjacent grains may deform coordinately, especially in shear and lateral deformation, and the characteristic deformation pattern is thereby formed on a mesoscopic scale.

  12. Comparison of source moment tensor recovered by diffraction stacking migration and source time reversal imaging

    Science.gov (United States)

    Zhang, Q.; Zhang, W.

    2017-12-01

    Diffraction stacking migration is an automatic location methods and widely used in microseismic monitoring of the hydraulic fracturing. It utilizes the stacking of thousands waveform to enhance signal-to-noise ratio of weak events. For surface monitoring, the diffraction stacking method is suffered from polarity reverse among receivers due to radiation pattern of moment source. Joint determination of location and source mechanism has been proposed to overcome the polarity problem but needs significantly increased computational calculations. As an effective method to recover source moment tensor, time reversal imaging based on wave equation can locate microseismic event by using interferometry on the image to extract source position. However, the time reversal imaging is very time consuming compared to the diffraction stacking location because of wave-equation simulation.In this study, we compare the image from diffraction stacking and time reversal imaging to check if the diffraction stacking can obtain similar moment tensor as time reversal imaging. We found that image produced by taking the largest imaging value at each point along time axis does not exhibit the radiation pattern, while with the same level of calculation efficiency, the image produced for each trial origin time can generate radiation pattern similar to time reversal imaging procedure. Thus it is potential to locate the source position by the diffraction stacking method for general moment tensor sources.

  13. In-situ high-energy X-ray diffraction and batch Rietveld refinement of phase changes in titanium aluminides

    International Nuclear Information System (INIS)

    Whitfield, R.

    2007-01-01

    Full text: We have used the Rietveld refinement method for the analysis of high-energy X-ray power diffraction for quantitatve phase analysis. This method has the advantage of being able to model the multiple phases appearing in the diffraction pattern and tell us about the composition of the phases of a sample as we change the temperature. It has been applied to various TiAl compounds allowing us to follow in detail the phase transitions of the intermetallics when heated to around 1400 0 Cand subsequently cooled. Small amounts of additives like V, Cr and Gd as well as signatures from different production processes can be seen to have an effect on the phase transitions. With increasing temperature we can see the evolution of the unit cell due to thermal expansion, chemical segregation and the relative proportion of phase changes

  14. High Pressure X-Ray Diffraction Studies on Nanocrystalline Materials

    Science.gov (United States)

    Palosz, B.; Stelmakh, S.; Grzanka, E.; Gierlotka, S.; Pielaszek, R.; Bismayer, U.; Werner, S.; Palosz, W.

    2003-01-01

    Application of in situ high pressure powder diffraction technique for examination of specific structural properties of nanocrystals based on the experimental data of SiC nanocrystalline powders of 2 to 30 nrn diameter in diameter is presented. Limitations and capabilities of the experimental techniques themselves and methods of diffraction data elaboration applied to nanocrystals with very small dimensions (nanoparticles of different grain size.

  15. Fabrication of Vertically Aligned Carbon Nanotube or Zinc Oxide Nanorod Arrays for Optical Diffraction Gratings.

    Science.gov (United States)

    Kim, Jeong; Kim, Sun Il; Cho, Seong-Ho; Hwang, Sungwoo; Lee, Young Hee; Hur, Jaehyun

    2015-11-01

    We report on new fabrication methods for a transparent, hierarchical, and patterned electrode comprised of either carbon nanotubes or zinc oxide nanorods. Vertically aligned carbon nanotubes or zinc oxide nanorod arrays were fabricated by either chemical vapor deposition or hydrothermal growth, in combination with photolithography. A transparent conductive graphene layer or zinc oxide seed layer was employed as the transparent electrode. On the patterned surface defined using photoresist, the vertically grown carbon nanotubes or zinc oxides could produce a concentrated electric field under applied DC voltage. This periodic electric field was used to align liquid crystal molecules in localized areas within the optical cell, effectively modulating the refractive index. Depending on the material and morphology of these patterned electrodes, the diffraction efficiency presented different behavior. From this study, we established the relationship between the hierarchical structure of the different electrodes and their efficiency for modulating the refractive index. We believe that this study will pave a new path for future optoelectronic applications.

  16. Near-surface density profiling of Fe ion irradiated Si (100) using extremely asymmetric x-ray diffraction by variation of the wavelength

    Energy Technology Data Exchange (ETDEWEB)

    Khanbabaee, B., E-mail: khanbabaee@physik.uni-siegen.de; Pietsch, U. [Solid State Physics, University of Siegen, D-57068 Siegen (Germany); Facsko, S. [Helmholtz-Zentrum Dresden-Rossendorf, 01314 Dresden (Germany); Doyle, S. [Synchrotron Light Source ANKA, Hermann-von-Helmholtz-Platz 1, D-76344 Eggenstein-Leopoldshafen (Germany)

    2014-10-20

    In this work, we report on correlations between surface density variations and ion parameters during ion beam-induced surface patterning process. The near-surface density variations of irradiated Si(100) surfaces were investigated after off-normal irradiation with 5 keV Fe ions at different fluences. In order to reduce the x-ray probing depth to a thickness below 5 nm, the extremely asymmetrical x-ray diffraction by variation of wavelength was applied, exploiting x-ray refraction at the air-sample interface. Depth profiling was achieved by measuring x-ray rocking curves as function of varying wavelengths providing incidence angles down to 0°. The density variation was extracted from the deviations from kinematical Bragg angle at grazing incidence angles due to refraction of the x-ray beam at the air-sample interface. The simulations based on the dynamical theory of x-ray diffraction revealed that while a net near-surface density decreases with increasing ion fluence which is accompanied by surface patterning, there is a certain threshold of ion fluence to surface density modulation. Our finding suggests that the surface density variation can be relevant with the mechanism of pattern formation.

  17. Multiorder nonlinear diffraction in frequency doubling processes

    DEFF Research Database (Denmark)

    Saltiel, Solomon M.; Neshev, Dragomir N.; Krolikowski, Wieslaw

    2009-01-01

    We analyze experimentally light scattering from 2 nonlinear gratings and observe two types of second-harmonic frequency-scattering processes. The first process is identified as Raman–Nath type nonlinear diffraction that is explained by applying only transverse phase-matching conditions. The angular...... position of this type of diffraction is defined by the ratio of the second-harmonic wavelength and the grating period. In contrast, the second type of nonlinear scattering process is explained by the longitudinal phase matching only, being insensitive to the nonlinear grating...

  18. Spatiotemporal optical pulse transformation by a resonant diffraction grating

    Energy Technology Data Exchange (ETDEWEB)

    Golovastikov, N. V.; Bykov, D. A., E-mail: bykovd@gmail.com; Doskolovich, L. L., E-mail: leonid@smr.ru; Soifer, V. A. [Russian Academy of Sciences, Image Processing Systems Institute (Russian Federation)

    2015-11-15

    The diffraction of a spatiotemporal optical pulse by a resonant diffraction grating is considered. The pulse diffraction is described in terms of the signal (the spatiotemporal incident pulse envelope) passage through a linear system. An analytic approximation in the form of a rational function of two variables corresponding to the angular and spatial frequencies has been obtained for the transfer function of the system. A hyperbolic partial differential equation describing the general form of the incident pulse envelope transformation upon diffraction by a resonant diffraction grating has been derived from the transfer function. A solution of this equation has been obtained for the case of normal incidence of a pulse with a central frequency lying near the guided-mode resonance of a diffraction structure. The presented results of numerical simulations of pulse diffraction by a resonant grating show profound changes in the pulse envelope shape that closely correspond to the proposed theoretical description. The results of the paper can be applied in creating new devices for optical pulse shape transformation, in optical information processing problems, and analog optical computations.

  19. Proton diffraction

    International Nuclear Information System (INIS)

    Den Besten, J.L.; Jamieson, D.N.; Allen, L.J.

    1998-01-01

    The Lindhard theory on ion channeling in crystals has been widely accepted throughout ion beam analysis for use in simulating such experiments. The simulations use a Monte Carlo method developed by Barret, which utilises the classical 'billiard ball' theory of ions 'bouncing' between planes or tubes of atoms in the crystal. This theory is not valid for 'thin' crystals where the planes or strings of atoms can no longer be assumed to be of infinite proportions. We propose that a theory similar to that used for high energy electron diffraction can be applied to MeV ions, especially protons, in thin crystals to simulate the intensities of transmission channeling and of RBS spectra. The diffraction theory is based on a Bloch wave solution of the Schroedinger equation for an ion passing through the periodic crystal potential. The widely used universal potential for proton-nucleus scattering is used to construct the crystal potential. Absorption due to thermal diffuse scattering is included. Experimental parameters such as convergence angle, beam tilt and scanning directions are considered in our calculations. Comparison between theory and experiment is encouraging and suggests that further work is justified. (authors)

  20. Three-dimensional diffraction of a thin metallic cylinder illuminated in conical incidence: application to diameter estimation

    International Nuclear Information System (INIS)

    Miguel Sanchez-Brea, Luis; Javier Salgado-Remacha, Francisco

    2008-01-01

    We present a model to determine the far-field diffraction pattern of a metallic cylinder of infinite length when it is illuminated in oblique incidence. This model is based on the Helmholtz-Kirchhoff integral using the Beckmann conditions for reflection. It considers the three-dimensional nature of the diffracting object as well as the material of which the cylinder is made. This model shows that the diffraction orders are placed in a cone of light. The amplitude at the far field can be divided into three terms: the first term accounts for Babinet's principle, that is, the contribution of the cylinder projection; the second term accounts for the three dimensionality of the cylinder; and the third term accounts for the material of which the cylinder is made. This model is applied to the diameter estimation of the cylinder. Since the amplitude of the Babinet contribution is much larger than the light reflected by the surface, the cylinder diameter can be obtained in a simple way. With this approximation, the locations of the diffraction minima do not vary when the cylinder is inclined. On the other hand, when the reflected light is considered the location of the minima and, hence, the estimation of the diameter, varies. Also, a modification of the diffraction minima is produced by the material of which the cylinder is made. Experimental results are also obtained that corroborate the theoretical approach

  1. Diffraction patterns in Fresnel approximation of periodic objects for a colorimeter of two apertures

    Science.gov (United States)

    Cortes-Reynoso, Jose-German R.; Suarez-Romero, Jose G.; Hurtado-Ramos, Juan B.; Tepichin-Rodriguez, Eduardo; Solorio-Leyva, Juan Carlos

    2004-10-01

    In this work, we present a study of Fresnel diffraction of periodic structures in an optical system of two apertures. This system of two apertures was used successfully for measuring color in textile samples solving the problems of illumination and directionality that present current commercial equipments. However, the system is sensible to the spatial frequency of the periodic sample"s area enclosed in its optical field of view. The study of Fresnel diffraction allows us to establish criteria for geometrical parameters of measurements in order to assure invariance in angular rotations and spatial positions. In this work, we use the theory of partial coherence to calculate the diffraction through two continuous apertures. In the calculation process, we use the concept of point-spread function of the system for partial coherence, in this way we avoid complicated statistical processes commonly used in the partial coherence theory.

  2. Observation of diffraction effects in positron channeling

    International Nuclear Information System (INIS)

    Palathingal, J.C.; Peng, J.P.; Lynn, K.G.; Wu, X.Y.; Schultz, P.J.

    1994-01-01

    An experimental investigation of positron channeling was made with a high-angular resolution apparatus, employing positrons of kinetic energy 1 MeV, derived from the Brookhaven National Laboratory Dynamitron. The pattern of transmission through a Si (100) single crystal of thickness 0.245 μm was investigated for a number of major planes. The authors have observed for the first time, in excellent detail, the fine structure of the channeling pattern expected to arise from the particle diffraction effects, theoretically explainable in terms of the quantum-mechanical many-beam calculations

  3. Ultrafast molecular imaging by laser-induced electron diffraction

    International Nuclear Information System (INIS)

    Peters, M.; Nguyen-Dang, T. T.; Cornaggia, C.; Saugout, S.; Charron, E.; Keller, A.; Atabek, O.

    2011-01-01

    We address the feasibility of imaging geometric and orbital structures of a polyatomic molecule on an attosecond time scale using the laser-induced electron diffraction (LIED) technique. We present numerical results for the highest molecular orbitals of the CO 2 molecule excited by a near-infrared few-cycle laser pulse. The molecular geometry (bond lengths) is determined within 3% of accuracy from a diffraction pattern which also reflects the nodal properties of the initial molecular orbital. Robustness of the structure determination is discussed with respect to vibrational and rotational motions with a complete interpretation of the laser-induced mechanisms.

  4. Phasor analysis of binary diffraction gratings with different fill factors

    International Nuclear Information System (INIS)

    MartInez, Antonio; Sanchez-Lopez, Ma del Mar; Moreno, Ignacio

    2007-01-01

    In this work, we present a simple analysis of binary diffraction gratings with different slit widths relative to the grating period. The analysis is based on a simple phasor technique directly derived from the Huygens principle. By introducing a slit phasor and a grating phasor, the intensity of the diffracted orders and the grating's resolving power can be easily obtained without applying the usual Fourier transform operations required for these calculations. The proposed phasor technique is mathematically equivalent to the Fourier transform calculation of the diffraction order amplitude, and it can be useful to explain binary diffraction gratings in a simple manner in introductory physics courses. This theoretical analysis is illustrated with experimental results using a liquid crystal device to display diffraction gratings with different fill factors

  5. Determination of patterns of interplanar distances starting from crystalline parameters for the Cyber computer of the ININ; Determinacion de patrones de distancias interplanares a partir de parametros cristalinos para la computadora Cyber del ININ

    Energy Technology Data Exchange (ETDEWEB)

    Macias B, L.R

    1991-03-15

    In this report a program in Fortran language that reproduces the pattern of the Joint Committee on Powder Diffraction Standards is presented and that it can be applied to identify non well-known samples such as in those that only by means of articles or other sources the values of the parameters of the elementary cell are lightly known and by this way the correspondent diffraction pattern can be accurately generated. (Author)

  6. Study of the α and β phases of quartz by neutron multiple diffraction

    International Nuclear Information System (INIS)

    Mazzocchi, V.L.

    1984-01-01

    Crystal structures of α and β phases of quartz are studied, employing neutron multiple diffraction as a method of analysis. Theoretical multiple diffraction patterns in a many-beam case were determined by a computer program which calculates intensities of beams as sums of Taylor's series expansions, retaining terms up to a order n. Experimental 'umweg' and transmitted beam patterns were obtained for the 00.1 primary reflection of α and β phases of quartz. To calculate α - quartz multiple diffraction intensities it was necessary to determine the Dauphine twinning fraction for the crystal after having passed by the β-phase. For the two models of β-quartz a better agreement between experimental and calculated integrated intensities was found for the disordered structure model based on split-half-oxigen positions. (Author) [pt

  7. Local, atomic-level elastic strain measurements of metallic glass thin films by electron diffraction

    Energy Technology Data Exchange (ETDEWEB)

    Ebner, C. [Physics of Nanostructured Materials, Faculty of Physics, University of Vienna, Boltzmanngasse 5, 1090 Vienna (Austria); Sarkar, R. [Department of Materials Science and Engineering, School for Engineering of Matter Transport and Energy, Arizona State University, Tempe 85287 (United States); Rajagopalan, J. [Department of Materials Science and Engineering, School for Engineering of Matter Transport and Energy, Arizona State University, Tempe 85287 (United States); Department of Mechanical and Aerospace Engineering, School for Engineering of Matter Transport and Energy, Arizona State University, Tempe 85287 (United States); Rentenberger, C., E-mail: christian.rentenberger@univie.ac.at [Physics of Nanostructured Materials, Faculty of Physics, University of Vienna, Boltzmanngasse 5, 1090 Vienna (Austria)

    2016-06-15

    A novel technique is used to measure the atomic-level elastic strain tensor of amorphous materials by tracking geometric changes of the first diffuse ring of selected area electron diffraction patterns (SAD). An automatic procedure, which includes locating the centre and fitting an ellipse to the diffuse ring with sub-pixel precision is developed for extracting the 2-dimensional strain tensor from the SAD patterns. Using this technique, atomic-level principal strains from micrometre-sized regions of freestanding amorphous Ti{sub 0.45}Al{sub 0.55} thin films were measured during in-situ TEM tensile deformation. The thin films were deformed using MEMS based testing stages that allow simultaneous measurement of the macroscopic stress and strain. The calculated atomic-level principal strains show a linear dependence on the applied stress, and good correspondence with the measured macroscopic strains. The calculated Poisson’s ratio of 0.23 is reasonable for brittle metallic glasses. The technique yields a strain accuracy of about 1×10{sup −4} and shows the potential to obtain localized strain profiles/maps of amorphous thin film samples. - Highlights: • A TEM method to measure elastic strain in metallic glass films is proposed. • Method is based on tracking geometric changes in TEM diffraction patterns. • An automatic procedure is developed for extracting the local strain tensor. • Atomic-level strain in amorphous TiAl film was analysed during in-situ deformation. • Capability of the method to obtain micrometer scale strain profiles/maps is shown.

  8. Diffractive flat panel solar concentrators of a novel design.

    Science.gov (United States)

    de Jong, Ties M; de Boer, Dick K G; Bastiaansen, Cees W M

    2016-07-11

    A novel design for a flat panel solar concentrator is presented which is based on a light guide with a grating applied on top that diffracts light into total internal reflection. By combining geometrical and diffractive optics the geometrical concentration ratio is optimized according to the principles of nonimaging optics, while the thickness of the device is minimized due to the use of total internal reflection.

  9. Imaging the proton via hard exclusive production in diffractive pp scattering

    International Nuclear Information System (INIS)

    Charles Hyde; Leonid Frankfurt; Mark Strikman; Christian Weiss

    2007-01-01

    We discuss the prospects for probing Generalized Parton Distributions (GPDs) via exclusive production of a high-mass system (H = heavy quarkonium, di-photon, di-jet, Higgs boson) in diffractive pp scattering, pp -> p + H + p. In such processes the interplay of hard and soft interactions gives rise to a diffraction pattern in the final-state proton transverse momenta, which is sensitive to the transverse spatial distribution of partons in the colliding protons. We comment on the plans for diffractive pp measurements at RHIC and LHC. Such studies could complement future measurements of GPDs in hard exclusive ep scattering (JLab, COMPASS, EIC)

  10. Coded diffraction system in X-ray crystallography using a boolean phase coded aperture approximation

    Science.gov (United States)

    Pinilla, Samuel; Poveda, Juan; Arguello, Henry

    2018-03-01

    Phase retrieval is a problem present in many applications such as optics, astronomical imaging, computational biology and X-ray crystallography. Recent work has shown that the phase can be better recovered when the acquisition architecture includes a coded aperture, which modulates the signal before diffraction, such that the underlying signal is recovered from coded diffraction patterns. Moreover, this type of modulation effect, before the diffraction operation, can be obtained using a phase coded aperture, just after the sample under study. However, a practical implementation of a phase coded aperture in an X-ray application is not feasible, because it is computationally modeled as a matrix with complex entries which requires changing the phase of the diffracted beams. In fact, changing the phase implies finding a material that allows to deviate the direction of an X-ray beam, which can considerably increase the implementation costs. Hence, this paper describes a low cost coded X-ray diffraction system based on block-unblock coded apertures that enables phase reconstruction. The proposed system approximates the phase coded aperture with a block-unblock coded aperture by using the detour-phase method. Moreover, the SAXS/WAXS X-ray crystallography software was used to simulate the diffraction patterns of a real crystal structure called Rhombic Dodecahedron. Additionally, several simulations were carried out to analyze the performance of block-unblock approximations in recovering the phase, using the simulated diffraction patterns. Furthermore, the quality of the reconstructions was measured in terms of the Peak Signal to Noise Ratio (PSNR). Results show that the performance of the block-unblock phase coded apertures approximation decreases at most 12.5% compared with the phase coded apertures. Moreover, the quality of the reconstructions using the boolean approximations is up to 2.5 dB of PSNR less with respect to the phase coded aperture reconstructions.

  11. X-ray powder diffraction data on miscellaneous lanthanide compounds

    International Nuclear Information System (INIS)

    Ferguson, I.F.; Hughes, T.E.

    1978-08-01

    Recent work on neutron absorbing materials has produced various new X-ray diffraction powder patterns of compounds of the lanthanides. Various inconsistencies in previously published data have been noted, and accurate measurements have been made of the lattice parameters of the rare earth oxides Sm 2 0 3 , Eu 2 0 3 , Gd 2 0 3 which have the monoclinic rare earth type B- structure, as well as Eu0. These data are recorded for reference. The optimum conditions for obtaining X-ray powder diffraction data from europium compounds are also noted. (author)

  12. LACDIF, a new electron diffraction technique obtained with the LACBED configuration and a C{sub s} corrector: Comparison with electron precession

    Energy Technology Data Exchange (ETDEWEB)

    Morniroli, J.P. [Laboratoire de Metallurgie Physique et Genie des Materiaux, UMR CNRS 8517, USTL and ENSCL, Cite Scientifique, 59655 Villeneuve d' Ascq (France)], E-mail: jean-paul.morniroli@univ-lille1.fr; Houdellier, F.; Roucau, C. [CEMES-CNRS, 29 Rue Jeanne Marvig, BP 94347, 31055 Toulouse Cedex 4 (France); Puiggali, J.; Gesti, S. [Departament d' Enginyeria Quimica, Universitat Politecnica de Catalunya, Av. Diagonal 647, 08028 Barcelona (Spain); Redjaimia, A. [Laboratoire de Science et Genie des Surfaces, UMR CNRS 7570, Ecole des Mines de Nancy, Parc de Saurupt 54042 Nancy (France)

    2008-01-15

    By combining the large-angle convergent-beam electron diffraction (LACBED) configuration together with a microscope equipped with a C{sub s} corrector it is possible to obtain good quality spot patterns in image mode and not in diffraction mode as it is usually the case. These patterns have two main advantages with respect to the conventional selected-area electron diffraction (SAED) or microdiffraction patterns. They display a much larger number of reflections and the diffracted intensity is the integrated intensity. These patterns have strong similarities with the electron precession patterns and they can be used for various applications like the identification of the possible space groups of a crystal from observations of the Laue zones or the ab-initio structure identifications. Since this is a defocused method, another important application concerns the analysis of electron beam-sensitive materials. Successful applications to polymers are given in the present paper to prove the validity of this method with regards to these materials.

  13. Refractive-index determination of solids from first- and second-order critical diffraction angles of periodic surface patterns

    International Nuclear Information System (INIS)

    Meichner, Christoph; Kador, Lothar; Schedl, Andreas E.; Neuber, Christian; Kreger, Klaus; Schmidt, Hans-Werner

    2015-01-01

    We present two approaches for measuring the refractive index of transparent solids in the visible spectral range based on diffraction gratings. Both require a small spot with a periodic pattern on the surface of the solid, collimated monochromatic light, and a rotation stage. We demonstrate the methods on a polydimethylsiloxane film (Sylgard ® 184) and compare our data to those obtained with a standard Abbe refractometer at several wavelengths between 489 and 688 nm. The results of our approaches show good agreement with the refractometer data. Possible error sources are analyzed and discussed in detail; they include mainly the linewidth of the laser and/or the angular resolution of the rotation stage. With narrow-band light sources, an angular accuracy of ±0.025 ∘ results in an error of the refractive index of typically ±5 ⋅ 10 −4 . Information on the sample thickness is not required

  14. Low-kilovolt coherent electron diffractive imaging instrument based on a single-atom electron source

    Energy Technology Data Exchange (ETDEWEB)

    Lin, Chun-Yueh [Department of Physics, National Taiwan University, Taipei 10617, Taiwan (China); Chang, Wei-Tse; Chen, Yi-Sheng; Hwu, En-Te; Chang, Chia-Seng; Hwang, Ing-Shouh, E-mail: ishwang@phys.sinica.edu.tw [Institute of Physics, Academia Sinica, Nankang, Taipei 11529, Taiwan (China); Hsu, Wei-Hao [Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan (China)

    2016-03-15

    In this work, a transmission-type, low-kilovolt coherent electron diffractive imaging instrument was constructed. It comprised a single-atom field emitter, a triple-element electrostatic lens, a sample holder, and a retractable delay line detector to record the diffraction patterns at different positions behind the sample. It was designed to image materials thinner than 3 nm. The authors analyzed the asymmetric triple-element electrostatic lens for focusing the electron beams and achieved a focused beam spot of 87 nm on the sample plane at the electron energy of 2 kV. High-angle coherent diffraction patterns of a suspended graphene sample corresponding to (0.62 Å){sup −1} were recorded. This work demonstrated the potential of coherent diffractive imaging of thin two-dimensional materials, biological molecules, and nano-objects at a voltage between 1 and 10 kV. The ultimate goal of this instrument is to achieve atomic resolution of these materials with high contrast and little radiation damage.

  15. Study of UO2 mechanical behaviour implanted with helium ions using X-ray micro-diffraction and mechanical modeling

    International Nuclear Information System (INIS)

    Ibrahim, Marcelle

    2015-01-01

    In order to study the mechanical behavior of nuclear fuel during direct long term storage, UO 2 polycrystals were implanted with Helium ions at a thin surface layer (1 μm approximately), which leads to stress and strain fields in the layer. Strains were measured, at the grains scale, by X-ray micro-diffraction, using synchrotron radiation (ESRF). Image analysis methods were developed for an automatic analysis of the large number of diffraction patterns. Applying statistical tools to Laue patterns allows an automatic detection of low quality images, and enhances the measurement precision. At low layer thickness, the mechanical interaction between grains can be neglected. At higher thickness, experimental results showed a higher mechanical interaction near grain boundaries that can be modeled using finite elements method. Geostatistical tools were used to quantify these interactions. The swelling and the elastic constants in the implanted layer can be estimated through the measured strains on a large number of grains with different orientations. This work allows the determination of the swelling of nuclear fuel in irradiation conditions, as well as the modification of its elastic properties. (author) [fr

  16. Phase analysis of nano-phase materials using selected area electron diffraction in the TEM

    International Nuclear Information System (INIS)

    Labar, J. L.

    2002-01-01

    In analogy to X-ray power diffraction (XRD), we are developing a method to help phase identification when examining a large number of grains simultaneously by electron diffraction. Although XRD is well established, it can not be used for small quantities of materials (volumes below 1 mm 3 ). Examining a usual TEM sample with thickness of 100 nm and using a selected area of 1 mm in diameter, the selected area electron diffraction pattern (SAED) carries information about several thousands of grains from a material with an average grain size of about 10 nm. The accuracy of XRD can not be attained by electron diffraction (ED). However, simultaneous visual observation of the nanostructure is an additional benefit of TEM (beside the small amount of needed material). The first step of the development project was the development of a computer program ('ProcessDiffraction') that processes digital versions of SAED patterns and presents them in an XRD-like form (intensity vs. scattering vector). In the present version (V2.0.3) phase identification is carried out by comparing the measured distribution to 'Markers', i.e. data of known phases. XRD data cards are used if the detailed structure of a phase is not known. Kinematic electron diffraction intensities are calculated for phases with known atomic positions (Author)

  17. Phasor analysis of binary diffraction gratings with different fill factors

    Energy Technology Data Exchange (ETDEWEB)

    MartInez, Antonio [Departamento de Ciencia de Materiales, Optica y TecnologIa Electronica, Universidad Miguel Hernandez, 03202 Elche (Spain); Sanchez-Lopez, Ma del Mar [Instituto de BioingenierIa y Departamento de Fisica y Arquitectura de Computadores, Universidad Miguel Hernandez, 03202 Elche (Spain); Moreno, Ignacio [Departamento de Ciencia de Materiales, Optica y TecnologIa Electronica, Universidad Miguel Hernandez, 03202 Elche (Spain)

    2007-09-11

    In this work, we present a simple analysis of binary diffraction gratings with different slit widths relative to the grating period. The analysis is based on a simple phasor technique directly derived from the Huygens principle. By introducing a slit phasor and a grating phasor, the intensity of the diffracted orders and the grating's resolving power can be easily obtained without applying the usual Fourier transform operations required for these calculations. The proposed phasor technique is mathematically equivalent to the Fourier transform calculation of the diffraction order amplitude, and it can be useful to explain binary diffraction gratings in a simple manner in introductory physics courses. This theoretical analysis is illustrated with experimental results using a liquid crystal device to display diffraction gratings with different fill factors.

  18. Sensitivity of photoelectron diffraction to conformational changes of adsorbed molecules: Tetra-tert-butyl-azobenzene/Au(111

    Directory of Open Access Journals (Sweden)

    A. Schuler

    2017-01-01

    Full Text Available Electron diffraction is a standard tool to investigate the atomic structure of surfaces, interfaces, and adsorbate systems. In particular, photoelectron diffraction is a promising candidate for real-time studies of structural dynamics combining the ultimate time resolution of optical pulses and the high scattering cross-sections for electrons. In view of future time-resolved experiments from molecular layers, we studied the sensitivity of photoelectron diffraction to conformational changes of only a small fraction of molecules in a monolayer adsorbed on a metallic substrate. 3,3′,5,5′-tetra-tert-butyl-azobenzene served as test case. This molecule can be switched between two isomers, trans and cis, by absorption of ultraviolet light. X-ray photoelectron diffraction patterns were recorded from tetra-tert-butyl-azobenzene/Au(111 in thermal equilibrium at room temperature and compared to patterns taken in the photostationary state obtained by exposing the surface to radiation from a high-intensity helium discharge lamp. Difference patterns were simulated by means of multiple-scattering calculations, which allowed us to determine the fraction of molecules that underwent isomerization.

  19. Report from the neutron diffraction work group

    International Nuclear Information System (INIS)

    1978-08-01

    This progress report of the neutron diffraction group at the Hahn Meitner Institute in Berlin comprises the following contributions: Three-dimensional critical properties of CsNiF 3 around the Neel point; Spin waves in CsNiF 3 with an applied magnetic field; Solitons in CsNiF 3 : Their experimental evidence and their thermodynamics; Neutron diffraction study of DAG at very low temperatures and in external magnetic field; Neutron diffraction investigation of tricritical behaviour in DyPO 4 ; Crystalline modifications and structural phase transitions of NaOH; Gitterdynamik von Cerhydrid; Investigation of the ferroelectric-ferroelastic phase transition in KH 2 PO 4 and RbH 2 PO 4 by means of γ-ray diffractometry; A γ-ray diffractometer for systematic measurements of absolute structure factors; Electron density in pyrite by combined γ-ray and neutron diffraction measurements: Thermal parameters from short wavelength neutron data; Accurate determination of temperature parameters from neutron diffraction data: Direct observation of the thermal diffuse scattering from silicon using perfect crystals; A Compton spectrometer for momentum density studies using 412 keV γ-radiation; Investigation of the electronic structure of Niobiumhydrides by means of gamma-ray Compton scattering; Interpretation of Compton profile data in position space; High resolution neutron scattering measurements on single crystals using a horizontally bent monochromator and a multidetecter; Statistical analysis of neutron diffraction studies of proteins. (orig.) [de

  20. Pair distribution functions of carbonaceous solids, determined using energy filtered diffraction

    International Nuclear Information System (INIS)

    Petersen, T.C.; McCulloch, D.G.

    2002-01-01

    Full text: The structures of various carbonaceous solids were investigated using energy filtered diffraction patterns collected in two dimensions using a Gatan Imaging Filter (GIF). In order to reduce multiple scattering and eliminate inelastic scattering effects, the diffraction patterns were filtered using an energy -selecting slit around the zero-loss peak. Software has been developed for the extraction of radially averaged pair distributions functions from the diffraction data. This entails finding the position of the un-scattered beam, radially averaging the two dimensional intensity distributions, calibrating the resulting one dimensional intensity profiles and finally normalising the data to obtain structure factors. Techniques for improving and assessing data quality, pertaining to the methodology used here, have also been explored. Structure factors and radial distribution functions generated using this analysis will be discussed and, for the commercial V25 glassy carbon samples, compared to previous, work of one of the authors'. In order to answer questions regarding multiple scattering effects and structural homogeneity of the samples, neutron scattering was performed on the Medium Resolution Powder Diffractometer (MRPD), at the Australian Nuclear Science and Technology's (ANSTO) facility. A critical comparison of the neutron scattering and electron diffraction generated structure factors will be presented. Copyright (2002) Australian Society for Electron Microscopy Inc

  1. The use of pattern decomposition to study the combined X-ray diffraction effects of crystallite size and stacking faults in ex-oxalate zinc oxide

    International Nuclear Information System (INIS)

    Langford, J.I.; Boultif, A.; Auffredic, J.P.; Louer, D.

    1993-01-01

    The microstructure of ZnO powder, obtained from thermal decomposition of the oxalate and studied previously by electron microscopy and adsorption calorimetry, was investigated by means of X-ray powder diffraction pattern decomposition. A Williamson-Hall plot revealed that some lines were broadened solely due to the effects of crystallite size, whereas other breadths included a contribution due to stacking faults. Spherical and cylindrical models are used to describe the form of the crystallites and procedures are presented for separating 'size' effects from 'mistake' broadening. This leads to estimates of the mean dimensions of the crystallites and the stacking-fault probability. The analysis demonstrates that, with good-quality data for a large number of reflections, a considerable amount of detailed information can be obtained about microstructure. On the other hand, it reveals some of the limitations of current procedures for modelling diffraction line profiles. (orig.)

  2. Renormalized multiple-scattering theory of photoelectron diffraction

    International Nuclear Information System (INIS)

    Biagini, M.

    1993-01-01

    The current multiple-scattering cluster techniques for the calculation of x-ray photoelectron and Auger-electron diffraction patterns consume much computer time in the intermediate-energy range (200--1000 eV); in fact, because of the large value of the electron mean free path and of the large forward-scattering amplitude at such energies, the electron samples a relatively large portion of the crystal, so that the number of paths to be considered becomes dramatically high. An alternative method is developed in the present paper: instead of calculating the individual contribution from each single path, the scattering matrix of each plane parallel to the surface is calculated with a renormalization process that calculates every scattering event in the plane up to infinite order. Similarly the scattering between two planes is calculated up to infinite order, and the double-plane scattering matrix is introduced. The process may then be applied to the calculation of a larger set of atomic layers. The advantage of the method is that a relatively small number of internuclear vectors have been used to obtain convergence in the calculation

  3. Theory of time-resolved inelastic x-ray diffraction

    DEFF Research Database (Denmark)

    Lorenz, Ulf; Møller, Klaus Braagaard; Henriksen, Niels Engholm

    2010-01-01

    Starting from a general theory of time-resolved x-ray scattering, we derive a convenient expression for the diffraction signal based on a careful analysis of the relevant inelastic scattering processes. We demonstrate that the resulting inelastic limit applies to a wider variety of experimental...... conditions than similar, previously derived formulas, and it directly allows the application of selection rules when interpreting diffraction signals. Furthermore, we present a simple extension to systems simultaneously illuminated by x rays and a laser beam....

  4. Elucidating structural order and disorder phenomena in mullite-type Al{sub 4}B{sub 2}O{sub 9} by automated electron diffraction tomography

    Energy Technology Data Exchange (ETDEWEB)

    Zhao, Haishuang; Krysiak, Yaşar [Institute of Inorganic Chemistry and Analytical Chemistry, Jakob-Welder-Weg 11, Johannes Gutenberg-University Mainz, 55128 Mainz (Germany); Hoffmann, Kristin [Crystallography, Department of Geosciences, Klagenfurter Str. 2, GEO, University of Bremen, 28359 Bremen (Germany); Institute of Inorganic Chemistry and Crystallography, Leobener Str. NW2, University of Bremen, 28359 Bremen (Germany); Barton, Bastian [Institute of Inorganic Chemistry and Analytical Chemistry, Jakob-Welder-Weg 11, Johannes Gutenberg-University Mainz, 55128 Mainz (Germany); Molina-Luna, Leopoldo [Department of Materials and Geoscience, Technische Universität Darmstadt, Petersenstr. 23, 64287 Darmstadt (Germany); Neder, Reinhard B. [Department of Physics, Lehrstuhl für Kristallographie und Strukturphysik, Friedrich-Alexander University Erlangen-Nürnberg, Staudtstr.3, 91058 Erlangen (Germany); Kleebe, Hans-Joachim [Department of Materials and Geoscience, Technische Universität Darmstadt, Petersenstr. 23, 64287 Darmstadt (Germany); Gesing, Thorsten M. [Institute of Inorganic Chemistry and Crystallography, Leobener Str. NW2, University of Bremen, 28359 Bremen (Germany); MAPEX Center for Materials and Processes, Bibliothekstr.1, University of Bremen, 28359 Bremen (Germany); Schneider, Hartmut [Crystallography, Department of Geosciences, Klagenfurter Str. 2, GEO, University of Bremen, 28359 Bremen (Germany); Fischer, Reinhard X. [Crystallography, Department of Geosciences, Klagenfurter Str. 2, GEO, University of Bremen, 28359 Bremen (Germany); MAPEX Center for Materials and Processes, Bibliothekstr.1, University of Bremen, 28359 Bremen (Germany); and others

    2017-05-15

    The crystal structure and disorder phenomena of Al{sub 4}B{sub 2}O{sub 9}, an aluminum borate from the mullite-type family, were studied using automated diffraction tomography (ADT), a recently established method for collection and analysis of electron diffraction data. Al{sub 4}B{sub 2}O{sub 9}, prepared by sol-gel approach, crystallizes in the monoclinic space group C2/m. The ab initio structure determination based on three-dimensional electron diffraction data from single ordered crystals reveals that edge-connected AlO{sub 6} octahedra expanding along the b axis constitute the backbone. The ordered structure (A) was confirmed by TEM and HAADF-STEM images. Furthermore, disordered crystals with diffuse scattering along the b axis are observed. Analysis of the modulation pattern implies a mean superstructure (AAB) with a threefold b axis, where B corresponds to an A layer shifted by ½a and ½c. Diffraction patterns simulated for the AAB sequence including additional stacking disorder are in good agreement with experimental electron diffraction patterns. - Graphical abstract: Crystal structure and disorder phenomena of B-rich Al{sub 4}B{sub 2}O{sub 9} studied by automated electron diffraction tomography (ADT) and described by diffraction simulation using DISCUS. - Highlights: • Ab-initio structure solution by electron diffraction from single nanocrystals. • Detected modulation corresponding mainly to three-fold superstructure. • Diffuse diffraction streaks caused by stacking faults in disordered crystals. • Observed streaks explained by simulated electron diffraction patterns.

  5. Symmetry, stability, and diffraction properties of icosahedral crystals

    International Nuclear Information System (INIS)

    Bak, P.

    1985-01-01

    In a remarkable experiment on an Mn-Al alloy, Shechtman et al. observed a diffraction spectrum with icosahedral symmetry. This is inconsistent with discrete translational invariance since the symmetry includes a five-fold axis. In this paper, it is shown that the crystallography and diffraction pattern can be described by a six-dimensional space group. The crystal structure in 3d is obtained as a cut along a 3d hyperplane in a regular 6d crystal. Displacements of the 6d crystal along 6 orthogonal directions define 6 continuous symmetries for the icosahedral crystal, three of which are phase symmetries describing internal rearrangements of the atoms

  6. Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping

    Energy Technology Data Exchange (ETDEWEB)

    Pekin, Thomas C. [Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, USA 94720 (United States); National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, USA 94720 (United States); Gammer, Christoph [Erich Schmid Institute of Materials Science, Jahnstrasse 12, Leoben, Austria 8700 (Austria); Ciston, Jim [National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, USA 94720 (United States); Minor, Andrew M. [Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, USA 94720 (United States); National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, USA 94720 (United States); Ophus, Colin, E-mail: cophus@gmail.com [National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, USA 94720 (United States)

    2017-05-15

    Scanning nanobeam electron diffraction strain mapping is a technique by which the positions of diffracted disks sampled at the nanoscale over a crystalline sample can be used to reconstruct a strain map over a large area. However, it is important that the disk positions are measured accurately, as their positions relative to a reference are directly used to calculate strain. In this study, we compare several correlation methods using both simulated and experimental data in order to directly probe susceptibility to measurement error due to non-uniform diffracted disk illumination structure. We found that prefiltering the diffraction patterns with a Sobel filter before performing cross correlation or performing a square-root magnitude weighted phase correlation returned the best results when inner disk structure was present. We have tested these methods both on simulated datasets, and experimental data from unstrained silicon as well as a twin grain boundary in 304 stainless steel.

  7. Spatially resolved determination of lattice distortions in silicon nanostructures by means of electron-backscattering diffraction

    International Nuclear Information System (INIS)

    Krause, Michael

    2013-01-01

    In the submitted thesis, a novel combined approach of both focused ion beam (FIB) based target preparation and strain determination using electron backscatter diffraction (EBSD) in semiconductor nanostructures is presented. In the first part, a powerful cross-correlation algorithm for detecting small feature shifts within EBSD patterns and, consequently, determining the strain, is presented. The corresponding strain sensitivity is demonstrated using dynamically simulated diffraction patterns. Furthermore, novel procedures for automated pattern analysis are introduced. Results of systematic studies concerning the influence of ion species, ion energy and dose density on the surface quality of silicon surfaces are presented in the second part. For that matter, the assessment of surface amorphization and rippling is based on high resolution microstructural diagnostics (TEM, AFM, Raman) and molecular dynamics simulation. The high application potential of combined FIB preparation and strain analysis using EBSD is exemplarily demonstrated for a 60 nm thick sSOI-sample. The good agreement with established techniques like Raman spectroscopy and X-ray diffraction is also shown.

  8. On the extension of the Fermi-Watson Theorem to high energy diffraction

    International Nuclear Information System (INIS)

    Malecki, A.; Istituto Nazionale di Fisica Nucleare, Frascati

    1995-12-01

    The Fermi-Watson theorem, established for low energy reactions and then applied to high energy collision, is revisited. Its use for the processes of inelastic diffraction is discussed. The theorem turns out to be valid in the case inclusive cross-section of diffractive transition

  9. Diffraction theory

    NARCIS (Netherlands)

    Bouwkamp, C.J.

    1954-01-01

    A critical review is presented of recent progress in classical diffraction theory. Both scalar and electromagnetic problems are discussed. The report may serve as an introduction to general diffraction theory although the main emphasis is on diffraction by plane obstacles. Various modifications of

  10. CL 19: Anisotropy of the electron diffraction from femtosecond Laser excited Bismuth

    International Nuclear Information System (INIS)

    Zhou, P.; Ligges, M.; Streubuehr, C.; Brazda, Th.; Payer, Th.; Meyer zu Heringdorf, F.; Horn-von Hoegen, M.; Von der Linde, D.

    2010-01-01

    We report an electron diffraction experiment in Bi in which a linearly polarized E g optical phonon mode is detected after excitation of the material by a femtosecond laser pulse. Bismuth is a semimetal with rhombohedral crystal structure with two atoms in the unit cell. There are two types of optical phonon modes: (i) The totally symmetric A 1g mode which corresponds to a displacement of the atoms along the trigonal (111) direction, and (ii) the doubly degenerate E g mode which represents a motion in the plane perpendicular to (111). The A 1g mode can be coherently excited both by displacive excitation (DE) and by impulsive stimulated Raman scattering (ISRS). Symmetry properties prevent DE of E g modes leaving ISRS as a likely excitation mechanism. We performed time resolved electron diffraction experiments on femtosecond laser excited Bi membranes of 15 nm thickness which were grown on a NaCl crystal and detached by floating in water. The experimental setup is described elsewhere. The fundamental laser beam (800 nm) was used for the excitation of the Bi films. The films had a crystalline structure with the (111) axis perpendicular to the surface. The electron beam passed perpendicular to the surface through the film. In this geometry the diffraction pattern is insensitive to atomic displacements along the (111) direction, i.e. insensitive to A 1g phonon modes. On the other hand, the excitation of E g modes corresponding to atomic displacements in the plane normal to (111) decreases the intensity of particular diffraction orders. The individual cycles of the E g vibrations (duration 475 fs) could not be resolved because our time resolution about 700 fs was not sufficient. In our experiment excitation beam with a fluence of 1 mJ/cm 2 and variable linear polarization was incident from the backside at an angle of 40 degrees (counter propagating electron and laser beam). The diffraction patterns were recorded as a function of the delay time between laser pump and

  11. Laser diffraction analysis of colloidal crystals

    Energy Technology Data Exchange (ETDEWEB)

    Sogami, Ikuo S.; Shinohara, Tadatomi; Yoshiyama, Tsuyoshi [Kyoto Sangyo Univ., Department of Physics, Kyoto (Japan)

    2001-10-01

    Laser diffraction analysis is made on crystallization in salt-free aqueous suspensions of highly-charged colloidal particles for semi-dilute specimens of concentration 0.1-10.0 vol%. Kossel diffraction patterns which represent faithfully accurate information on lattice symmetries in the suspensions enable us to investigate the time evolution of colloidal crystals. The results show that the crystallization proceeds by way of the following intermediate phase transitions: two-dimensional hcp structure {yields} random layer structure {yields} layer structure with one sliding degree of freedom {yields} stacking disorder structure {yields} stacking structure with multivariant periodicity {yields} fcc twin structure with twin plane (111) {yields} normal fcc structure {yields} bcc twin structure with twin plane (11-bar2) or (1-bar12) {yields} normal bcc structure. For concentrated suspensions (>2 vol %), the phase transition ceases to proceed at the normal fcc structure. (author)

  12. Laser diffraction analysis of colloidal crystals

    International Nuclear Information System (INIS)

    Sogami, Ikuo S.; Shinohara, Tadatomi; Yoshiyama, Tsuyoshi

    2001-01-01

    Laser diffraction analysis is made on crystallization in salt-free aqueous suspensions of highly-charged colloidal particles for semi-dilute specimens of concentration 0.1-10.0 vol%. Kossel diffraction patterns which represent faithfully accurate information on lattice symmetries in the suspensions enable us to investigate the time evolution of colloidal crystals. The results show that the crystallization proceeds by way of the following intermediate phase transitions: two-dimensional hcp structure → random layer structure → layer structure with one sliding degree of freedom → stacking disorder structure → stacking structure with multivariant periodicity → fcc twin structure with twin plane (111) → normal fcc structure → bcc twin structure with twin plane (11-bar2) or (1-bar12) → normal bcc structure. For concentrated suspensions (>2 vol %), the phase transition ceases to proceed at the normal fcc structure. (author)

  13. X-ray diffraction studies of chitosan acetate-based polymer electrolytes

    International Nuclear Information System (INIS)

    Osman, Z.; Ibrahim, Z.A.; Abdul Kariem Arof

    2002-01-01

    Chitosan is the product when partially deacetylated chitin dissolves in dilute acetic acid. This paper presents the x-ray diffraction patterns of chitosan acetate, plasticised chitosan acetate and plasticised-salted chitosan acetate films. The results show that the chitosan acetate based polymer electrolyte films are not completely amorphous but it is partially crystalline. X-ray diffraction study also confirms the occurrence of the complexation between chitosan and the salt and the interaction between salt and plasticizer. The salt-chitosan interaction is clearly justified by infrared spectroscopy. (Author)

  14. Diffraction by an immersed elastic wedge

    CERN Document Server

    Croisille, Jean-Pierre

    1999-01-01

    This monograph presents the mathematical description and numerical computation of the high-frequency diffracted wave by an immersed elastic wave with normal incidence. The mathematical analysis is based on the explicit description of the principal symbol of the pseudo-differential operator connected with the coupled linear problem elasticity/fluid by the wedge interface. This description is subsequently used to derive an accurate numerical computation of diffraction diagrams for different incoming waves in the fluid, and for different wedge angles. The method can be applied to any problem of coupled waves by a wedge interface. This work is of interest for any researcher concerned with high frequency wave scattering, especially mathematicians, acousticians, engineers.

  15. Diffraction experiments of argon or helium on polluted surfaces

    International Nuclear Information System (INIS)

    Berthier, J.P.; Constans, A.; Daury, G.; Lostis, P.

    1975-01-01

    Scattering patterns of molecular beams of argon or helium from metal surfaces (bulk metal or thin films) are reported. The pressure in the scattering chamber is about 10 -6 torr. So, the surfaces are polluted. Diffraction peaks are observed which can be interpreted very well by assuming that nitrogen, oxygen or carbon atoms are adsorbed of the surface. On the other hand, diffraction peaks from a silicon crystal have been observed which can be reproduced very well by using silicon crystal lattice. These experiments are not interpreted accurately, but show that molecular reflection can be used for some surface studies [fr

  16. Mapping 180° polar domains using electron backscatter diffraction and dynamical scattering simulations

    Energy Technology Data Exchange (ETDEWEB)

    Burch, Matthew J.; Fancher, Chris M.; Patala, Srikanth [Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC (United States); De Graef, Marc [Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburg, PA (United States); Dickey, Elizabeth C. [Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC (United States)

    2017-02-15

    A novel technique, which directly and nondestructively maps polar domains using electron backscatter diffraction (EBSD) is described and demonstrated. Through dynamical diffraction simulations and quantitative comparison to experimental EBSD patterns, the absolute orientation of a non-centrosymmetric crystal can be determined. With this information, the polar domains of a material can be mapped. The technique is demonstrated by mapping the non-ferroelastic, or 180°, ferroelectric domains in periodically poled LiNbO{sub 3} single crystals. Further, the authors demonstrate the possibility of mapping polarity using this technique in other polar materials system. - Highlights: • A novel technique to directly polar domains utilizing EBSD is demonstrated. • The technique relies on dynamical diffraction simulations of EBSD patterns. • The technique is demonstrated by mapping 180° domains in LiNbO{sub 3} single crystals. • Further application of this technique to other materials classes is discussed.

  17. Grain orientation mapping of passivated aluminum interconnect lines with X-ray micro-diffraction

    International Nuclear Information System (INIS)

    Chang, C.H.; Patel, J.R.; MacDowell, A.A.; Padmore, H.A.; Thompson, A.C.

    1998-01-01

    A micro x-ray diffraction facility is under development at the Advanced Light Source. Spot sizes are typically about 1-microm size generated by means of grazing incidence Kirkpatrick-Baez focusing mirrors. Photon energy is either white of energy range 6--14 keV or monochromatic generated from a pair of channel cut crystals. Laue diffraction pattern from a single grain in a passivated 2-microm wide bamboo structured Aluminum interconnect line has been recorded. Acquisition times are of the order of seconds. The Laue pattern has allowed the determination of the crystallographic orientation of individual grains along the line length. The experimental and analysis procedure used is described, as is the latest grain orientation result. The impact of x-ray micro-diffraction and its possible future direction are discussed in the context of other developments in the area of electromigration, and other technological problems

  18. Grain orientation mapping of passivated aluminum interconnect lines by x-ray micro-diffraction

    International Nuclear Information System (INIS)

    Chang, C. H.; Patel, J. R.; MacDowell, A. A.; Padmore, H. A.; Thompson, A. C.

    1998-01-01

    A micro x-ray diffraction facility is under development at the Advanced Light Source. Spot sizes are typically about 1-μm size generated by means of grazing incidence Kirkpatrick-Baez focusing mirrors. Photon energy is either white of energy range 6-14 keV or monochromatic generated from a pair of channel cut crystals. Laue diffraction pattern from a single grain in a passivated 2-μm wide bamboo structured Aluminum interconnect line has been recorded. Acquisition times are of the order of seconds. The Laue pattern has allowed the determination of the crystallographic orientation of individual grains along the line length. The experimental and analysis procedure used is described, as is the latest grain orientation result. The impact of x-ray micro-diffraction and its possible future direction are discussed in the context of other developments in the area of electromigration, and other technological problems

  19. Neutron diffraction studies of water in meso- and micro-pores

    International Nuclear Information System (INIS)

    Steytler, D.C.; Dore, J.C.; Wright, C.J.

    1982-07-01

    Neutron diffraction studies have been made for D 2 O water in two high surface-area silica samples, Spherisorb and Gasil. The results show that the structural arrangement is similar to that of bulk water and that the modification due to the interface is restricted to a range of the order of 10 A or less. Measurements also indicate that the dispersed water undergoes significant structural changes with temperature variation but the behaviour is similar to that of the bulk liquid. The differences observed in the diffraction patterns can be partially described in terms of diffraction broadening due to the small volume of the dispersed water but there remains a significant variation which appears to be related to the hydrogen-bonding interactions. (author)

  20. Structural investigation of GaInP nanowires using X-ray diffraction

    DEFF Research Database (Denmark)

    Kriegner, D.; Persson, Johan Mikael; Etzelstorfer, T.

    2013-01-01

    In this work the structure of ternary GaxIn1−xP nanowires is investigated with respect to the chemical composition and homogeneity. The nanowires were grown by metal–organic vapor-phase epitaxy. For the investigation of ensemble fluctuations on several lateral length scales, X-ray diffraction...... gradients along the sample by recording diffraction patterns at different positions. In addition, compositional variations were found also within single nanowires in X-ray energy dispersive spectroscopy measurements....

  1. On the evaluation of X-ray diffraction experiments by the regularization method

    Energy Technology Data Exchange (ETDEWEB)

    Trubin, V.A.; Szasz, A. (Lab. of Surface and Interface Physics, Eoetvoes Univ., Budapest (Hungary))

    1991-05-16

    The characteristic property of diffractometers as the presence of occasional and systematic errors in measured patterns requires such an evaluation which is as informative as possible. This circumstance gives rise to the problem of optimal planning of the experiment. The X-ray diffraction optimization problem with application of the regularization method is studied. The proposal permits to determine more accurately the unknown true characteristics of the X-ray diffraction experiment. (orig.).

  2. On the evaluation of X-ray diffraction experiments by the regularization method

    International Nuclear Information System (INIS)

    Trubin, V.A.; Szasz, A.

    1991-01-01

    The characteristic property of diffractometers as the presence of occasional and systematic errors in measured patterns requires such an evaluation which is as informative as possible. This circumstance gives rise to the problem of optimal planning of the experiment. The X-ray diffraction optimization problem with application of the regularization method is studied. The proposal permits to determine more accurately the unknown true characteristics of the X-ray diffraction experiment. (orig.)

  3. Tensometry technique for X-ray diffraction in applied analysis of welding

    International Nuclear Information System (INIS)

    Turibus, S.N.; Caldas, F.C.M.; Miranda, D.M.; Monine, V.I.; Assis, J.T.

    2010-01-01

    This paper presents the analysis of residual stress introduced in welding process. As the stress in a material can induce damages, it is necessary to have a method to identify this residual stress state. For this it was used the non-destructive X-ray diffraction technique to analyze two plates from A36 steel jointed by metal inert gas (MIG) welding. The stress measurements were made by the sin 2 ψ method in weld region of steel plates including analysis of longitudinal and transverse residual stresses in fusion zone, heat affected zone (HAZ) and base metal. To determine the stress distribution along the depth of the welded material it was used removing of superficial layers made by electropolishing. (author)

  4. Analysis of the diffraction peaks in the ZrCr2 system

    International Nuclear Information System (INIS)

    Quiroga, A.A.; Esquivel, M.R.

    2009-01-01

    In this work, the crystalline structures of Cr and Zr are characterized by X-ray Diffraction (XRD). The diffraction peaks are simulated using a numerical convolution of the Gauss and Lorentz functions. The simulation of the model is verified using empirical measurements of the diffraction peaks. From these results, the microstructure parameters of Zr and Cr are obtained: crystallite size (d) and strain (s). The advances obtained are used in the design of the synthesis of AB 2 intermetallics applied to thermal compression of hydrogen (Tch). (author)

  5. Crystallization and preliminary X-ray diffraction analysis of West Nile virus

    International Nuclear Information System (INIS)

    Kaufmann, Bärbel; Plevka, Pavel; Kuhn, Richard J.; Rossmann, Michael G.

    2010-01-01

    Crystals of infectious West Nile virus were obtained and diffracted at best to about 25 Å resolution. Preliminary analysis of the diffraction pattern suggested tight hexagonal packing of the intact virus. West Nile virus, a human pathogen, is closely related to other medically important flaviviruses of global impact such as dengue virus. The infectious virus was purified from cell culture using polyethylene glycol (PEG) precipitation and density-gradient centrifugation. Thin amorphously shaped crystals of the lipid-enveloped virus were grown in quartz capillaries equilibrated by vapor diffusion. Crystal diffraction extended at best to a resolution of about 25 Å using synchrotron radiation. A preliminary analysis of the diffraction images indicated that the crystals had unit-cell parameters a ≃ b ≃ 480 Å, γ = 120°, suggesting a tight hexagonal packing of one virus particle per unit cell

  6. Digital Image Correlation of 2D X-ray Powder Diffraction Data for Lattice Strain Evaluation

    Science.gov (United States)

    Zhang, Hongjia; Sui, Tan; Daisenberger, Dominik; Fong, Kai Soon

    2018-01-01

    High energy 2D X-ray powder diffraction experiments are widely used for lattice strain measurement. The 2D to 1D conversion of diffraction patterns is a necessary step used to prepare the data for full pattern refinement, but is inefficient when only peak centre position information is required for lattice strain evaluation. The multi-step conversion process is likely to lead to increased errors associated with the ‘caking’ (radial binning) or fitting procedures. A new method is proposed here that relies on direct Digital Image Correlation analysis of 2D X-ray powder diffraction patterns (XRD-DIC, for short). As an example of using XRD-DIC, residual strain values along the central line in a Mg AZ31B alloy bar after 3-point bending are calculated by using both XRD-DIC and the conventional ‘caking’ with fitting procedures. Comparison of the results for strain values in different azimuthal angles demonstrates excellent agreement between the two methods. The principal strains and directions are calculated using multiple direction strain data, leading to full in-plane strain evaluation. It is therefore concluded that XRD-DIC provides a reliable and robust method for strain evaluation from 2D powder diffraction data. The XRD-DIC approach simplifies the analysis process by skipping 2D to 1D conversion, and opens new possibilities for robust 2D powder diffraction data analysis for full in-plane strain evaluation. PMID:29543728

  7. Digital Image Correlation of 2D X-ray Powder Diffraction Data for Lattice Strain Evaluation

    Directory of Open Access Journals (Sweden)

    Hongjia Zhang

    2018-03-01

    Full Text Available High energy 2D X-ray powder diffraction experiments are widely used for lattice strain measurement. The 2D to 1D conversion of diffraction patterns is a necessary step used to prepare the data for full pattern refinement, but is inefficient when only peak centre position information is required for lattice strain evaluation. The multi-step conversion process is likely to lead to increased errors associated with the ‘caking’ (radial binning or fitting procedures. A new method is proposed here that relies on direct Digital Image Correlation analysis of 2D X-ray powder diffraction patterns (XRD-DIC, for short. As an example of using XRD-DIC, residual strain values along the central line in a Mg AZ31B alloy bar after 3-point bending are calculated by using both XRD-DIC and the conventional ‘caking’ with fitting procedures. Comparison of the results for strain values in different azimuthal angles demonstrates excellent agreement between the two methods. The principal strains and directions are calculated using multiple direction strain data, leading to full in-plane strain evaluation. It is therefore concluded that XRD-DIC provides a reliable and robust method for strain evaluation from 2D powder diffraction data. The XRD-DIC approach simplifies the analysis process by skipping 2D to 1D conversion, and opens new possibilities for robust 2D powder diffraction data analysis for full in-plane strain evaluation.

  8. Photoelectron diffraction and holography: Present status and future prospects

    Energy Technology Data Exchange (ETDEWEB)

    Fadley, C.S. [California Univ., Davis, CA (United States). Dept. of Physics]|[Lawrence Berkeley Lab., CA (United States); Thevuthasan, S. [California Univ., Davis, CA (United States). Dept. of Physics; Kaduwela, A.P. [Lawrence Berkeley Lab., CA (United States)] [and others

    1993-07-01

    Photoelectron diffraction and photoelectron holography, a newly developed variant of it, can provide a rich range of information concerning surface structure. These methods are sensitive to atomic type, chemical state, and spin state. The theoretical prediction of diffraction patterns is also well developed at both the single scattering and multiple scattering levels, and quantitative fits of experiment to theory can lead to structures with accuracies in the {plus_minus}0.03 {Angstrom} range. Direct structural information can also be derived from forward scattering in scanned-angle measurements at higher energies, path length differences contained in scanned-energy data at lower energies, and holographic inversions of data sets spanning some region in angle and energy space. Diffraction can also affect average photoelectron emission depths. Circular dichroism in core-level emission can be fruitfully interpreted in terms of photoelectron diffraction theory, as can measurements with spin-resolved core-spectra, and studies of surface magnetic structures and phase transitions should be possible with these methods. Synchrotron radiation is a key element of fully utilizing these techniques.

  9. Pattern recognition applied to uranium prospecting

    Energy Technology Data Exchange (ETDEWEB)

    Briggs, P L; Press, F [Massachusetts Inst. of Tech., Cambridge (USA). Dept. of Earth and Planetary Sciences

    1977-07-14

    It is stated that pattern recognition techniques provide one way of combining quantitative and descriptive geological data for mineral prospecting. A quantified decision process using computer-selected patterns of geological data has the potential for selecting areas with undiscovered deposits of uranium or other minerals. When a natural resource is mined more rapidly than it is discovered, its continued production becomes increasingly difficult, and it has been noted that, although a considerable uranium reserve may remain in the U.S.A., the discovery rate for uranium is decreasing exponentially with cumulative exploration footage drilled. Pattern recognition methods of organising geological information for prospecting may provide new predictive power, as well as insight into the occurrence of uranium ore deposits. Often the task of prospecting consists of three stages of information processing: (1) collection of data on known ore deposits; (2) noting any regularities common to the known examples of an ore; (3) selection of new exploration targets based on the results of the second stage. A logical pattern recognition algorithm is here described that implements this geological procedure to demonstrate the possibility of building a quantified uranium prospecting guide from diverse geologic data.

  10. Highlighting material structure with transmission electron diffraction correlation coefficient maps

    International Nuclear Information System (INIS)

    Kiss, Ákos K.; Rauch, Edgar F.; Lábár, János L.

    2016-01-01

    Correlation coefficient maps are constructed by computing the differences between neighboring diffraction patterns collected in a transmission electron microscope in scanning mode. The maps are shown to highlight material structural features like grain boundaries, second phase particles or dislocations. The inclination of the inner crystal interfaces are directly deduced from the resulting contrast. - Highlights: • We propose a novel technique to image the structure of polycrystalline TEM-samples. • Correlation coefficients maps highlights the evolution of the diffracting signal. • 3D views of grain boundaries are provided for nano-particles or polycrystals.

  11. Electro-optic sampling for time resolving relativistic ultrafast electron diffraction

    International Nuclear Information System (INIS)

    Scoby, C. M.; Musumeci, P.; Moody, J.; Gutierrez, M.; Tran, T.

    2009-01-01

    The Pegasus laboratory at UCLA features a state-of-the-art electron photoinjector capable of producing ultrashort (<100 fs) high-brightness electron bunches at energies of 3.75 MeV. These beams recently have been used to produce static diffraction patterns from scattering off thin metal foils, and it is foreseen to take advantage of the ultrashort nature of these bunches in future pump-probe time-resolved diffraction studies. In this paper, single shot 2-d electro-optic sampling is presented as a potential technique for time of arrival stamping of electron bunches used for diffraction. Effects of relatively low bunch charge (a few 10's of pC) and modestly relativistic beams are discussed and background compensation techniques to obtain high signal-to-noise ratio are explored. From these preliminary tests, electro-optic sampling is suitable to be a reliable nondestructive time stamping method for relativistic ultrafast electron diffraction at the Pegasus lab.

  12. Study of the ferrimagnetic and paramagnetic phases of magnetite measured by multiple neutron diffraction

    International Nuclear Information System (INIS)

    Mazzocchi, V.L.

    1992-01-01

    Structural parameters of the ferrimagnetic and paramagnetic phases of magnetite have been refined from neutron multiple diffraction data. Experimental multiple diffraction patterns used in the refinement, were obtained by measuring the 111 primary reflection of a natural single crystal of this compound, at room temperature for the ferrimagnetic phase and 703 0 C for the paramagnetic phase. Corresponding theoretical patterns for both phases have been calculated by the program MULTI which uses the iterative method for the intensity calculations in neutron multiple diffraction. In this method intensities are calculated as Taylor series expansions summed up to a order sufficient for a good approximation. A step by step process has been used in the refinements according to the parameter-shift method. Both isotropic and anisotropic thermal parameters were used in the calculation of the temperature factor. (author)

  13. Industrial applications of neutron diffraction

    International Nuclear Information System (INIS)

    Felcher, G.P.

    1989-01-01

    Neutron diffraction (or, to be more general, neutron scattering) is a most versatile and universal tool, which has been widely employed to probe the structure, the dynamics and the magnetism of condensed matter. Traditionally used for fundamental research in solid state physics, this technique more recently has been applied to problems of immediate industrial interest, as illustrated in examples covering the main fields of endeavour. 14 refs., 14 figs

  14. X-ray and Neutron Diffraction in the Study of Organic Crystalline Hydrates

    Directory of Open Access Journals (Sweden)

    Katharina Fucke

    2010-07-01

    Full Text Available A review. Diffraction methods are a powerful tool to investigate the crystal structure of organic compounds in general and their hydrates in particular. The laboratory standard technique of single crystal X-ray diffraction gives information about the molecular conformation, packing and hydrogen bonding in the crystal structure, while powder X-ray diffraction on bulk material can trace hydration/dehydration processes and phase transitions under non-ambient conditions. Neutron diffraction is a valuable complementary technique to X-ray diffraction and gives highly accurate hydrogen atom positions due to the interaction of the radiation with the atomic nuclei. Although not yet often applied to organic hydrates, neutron single crystal and neutron powder diffraction give precise structural data on hydrogen bonding networks which will help explain why hydrates form in the first place.

  15. Diffractive heavy quark production in AA collisions at the LHC at NLO

    Science.gov (United States)

    Machado, M. M.; Ducati, M. B. Gay; Machado, M. V. T.

    2011-07-01

    The single and double diffractive cross sections for heavy quarks production are evaluated at NLO accuracy for hadronic and heavy ion collisions at the LHC. Diffractive charm and bottom production is the main subject of this work, providing predictions for CaCa, PbPb and pPb collisions. The hard diffraction formalism is considered using the Ingelman-Schlein model where a recent parametrization for the Pomeron structure function (DPDF) is applied. Absorptive corrections are taken into account as well. The diffractive ratios are estimated and theoretical uncertainties are discussed. Comparison with competing production channels is also presented.

  16. A versatile diffractive maskless lithography for single-shot and serial microfabrication.

    Science.gov (United States)

    Jenness, Nathan J; Hill, Ryan T; Hucknall, Angus; Chilkoti, Ashutosh; Clark, Robert L

    2010-05-24

    We demonstrate a diffractive maskless lithographic system that is capable of rapidly performing both serial and single-shot micropatterning. Utilizing the diffractive properties of phase holograms displayed on a spatial light modulator, arbitrary intensity distributions were produced to form two and three dimensional micropatterns/structures in a variety of substrates. A straightforward graphical user interface was implemented to allow users to load templates and change patterning modes within the span of a few minutes. A minimum resolution of approximately 700 nm is demonstrated for both patterning modes, which compares favorably to the 232 nm resolution limit predicted by the Rayleigh criterion. The presented method is rapid and adaptable, allowing for the parallel fabrication of microstructures in photoresist as well as the fabrication of protein microstructures that retain functional activity.

  17. Rietveld analysis using powder diffraction data with anomalous scattering effect obtained by focused beam flat sample method

    International Nuclear Information System (INIS)

    Tanaka, Masahiko; Katsuya, Yoshio; Sakata, Osami

    2016-01-01

    Focused-beam flat-sample method (FFM) is a new trial for synchrotron powder diffraction method, which is a combination of beam focusing optics, flat shape powder sample and area detectors. The method has advantages for X-ray diffraction experiments applying anomalous scattering effect (anomalous diffraction), because of 1. Absorption correction without approximation, 2. High intensity X-rays of focused incident beams and high signal noise ratio of diffracted X-rays 3. Rapid data collection with area detectors. We applied the FFM to anomalous diffraction experiments and collected synchrotron X-ray powder diffraction data of CoFe_2O_4 (inverse spinel structure) using X-rays near Fe K absorption edge, which can distinguish Co and Fe by anomalous scattering effect. We conducted Rietveld analyses with the obtained powder diffraction data and successfully determined the distribution of Co and Fe ions in CoFe_2O_4 crystal structure.

  18. Extended ABCD matrix formalism for the description of femtosecond diffraction patterns; application to femtosecond digital in-line holography with anamorphic optical systems.

    Science.gov (United States)

    Brunel, Marc; Shen, Huanhuan; Coetmellec, Sebastien; Lebrun, Denis

    2012-03-10

    We present a new model to predict diffraction patterns of femtosecond pulses through complex optical systems. The model is based on the extension of an ABCD matrix formalism combined with generalized Huygens-Fresnel transforms (already used in the CW regime) to the femtosecond regime. The model is tested to describe femtosecond digital in-line holography experiments realized in situ through a cylindrical Plexiglas pipe. The model allows us to establish analytical relations that link the holographic reconstruction process to the experimental parameters of the pipe and of the incident beam itself. Simulations and experimental results are in good concordance. Femtosecond digital in-line holography is shown to allow significant coherent noise reduction, and this model will be particularly efficient to describe a wide range of optical geometries. More generally, the model developed can be easily used in any experiment where the knowledge of the precise evolution of femtosecond transverse patterns is required.

  19. Enhancing core-diffracted arrivals by supervirtual interferometry

    KAUST Repository

    Bharadwaj, P.

    2013-12-03

    A supervirtual interferometry (SVI) method is presented that can enhance the signal-to-noise ratio (SNR) of core diffracted waveforms by as much as O( √ N), where N is the number of inline receivers that record the core-mantle boundary (CMB) diffractions from more than one event. Here, the events are chosen to be approximately inline with the receivers along the same great circle. Results with synthetic and teleseismic data recorded by USArray stations demonstrate that formerly unusable records with low SNR can be transformed to high SNR records with clearly visible CMB diffractions. Another benefit is that SVI allows for the recording of a virtual earthquake at stations not deployed during the time of the earthquake. This means that portable arrays such as USArray can extend the aperture of one recorded earthquake from the West coast to the East coast, even though the teleseism might have only been recorded during theWest coast deployment. In summary, SVI applied to teleseismic data can significantly enlarge the catalogue of usable records both in SNR and available aperture for analysing CMB diffractions. A potential drawback of this method is that it generally provides the correct kinematics of CMB diffractions, but does not necessarily preserve correct amplitude information. © The Authors 2013. Published by Oxford University Press on behalf of The Royal Astronomical Society.

  20. Micro-channel plate detector for ultra-fast relativistic electron diffraction

    International Nuclear Information System (INIS)

    Musumeci, P.; Moody, J.T.; Scoby, C.M.; Gutierrez, M.S.; Bender, H.A.; Hilko, B.; Kruschwitz, C.A.; Wilcox, N.S.

    2011-01-01

    Using relativistic ultra-short electron beams to obtain single-shot diffraction patterns holds the promise to yield real-time resolution of atomic motion in an easily accessible environment, such as a university laboratory, at a fraction of the cost of fourth-generation X-ray sources. One of the main issues in bringing this technique to full maturity is the development of efficient detector systems to record the diffraction pattern using a few MeV electron beams. Low noise, high spatial resolution, and single-electron detection capability are all characteristics of an ideal detector. In this paper, we compare the performances of a traditional fluorescent phosphor screen with a detection system based on the micro-channel plate (MCP). Since MCPs are typically used with lower energy electron beams, these tests constitute one of the few experimental data points available on the use of these devices with MeV energy beams.

  1. Micro-channel plate detector for ultra-fast relativistic electron diffraction

    Energy Technology Data Exchange (ETDEWEB)

    Musumeci, P., E-mail: musumeci@physics.ucla.edu [UCLA Department of Physics and Astronomy, 475 Portola Plaza, Los Angeles, CA, 90095-1547 (United States); Moody, J.T.; Scoby, C.M.; Gutierrez, M.S. [UCLA Department of Physics and Astronomy, 475 Portola Plaza, Los Angeles, CA, 90095-1547 (United States); Bender, H.A.; Hilko, B.; Kruschwitz, C.A.; Wilcox, N.S. [National Security Technologies, LLC, Los Alamos Operations, Los Alamos, NM (United States)

    2011-05-01

    Using relativistic ultra-short electron beams to obtain single-shot diffraction patterns holds the promise to yield real-time resolution of atomic motion in an easily accessible environment, such as a university laboratory, at a fraction of the cost of fourth-generation X-ray sources. One of the main issues in bringing this technique to full maturity is the development of efficient detector systems to record the diffraction pattern using a few MeV electron beams. Low noise, high spatial resolution, and single-electron detection capability are all characteristics of an ideal detector. In this paper, we compare the performances of a traditional fluorescent phosphor screen with a detection system based on the micro-channel plate (MCP). Since MCPs are typically used with lower energy electron beams, these tests constitute one of the few experimental data points available on the use of these devices with MeV energy beams.

  2. Diffractive optical elements written by photodeposition

    International Nuclear Information System (INIS)

    Baal-Zedaka, I.; Hava, S.; Mirchin, N.; Margolin, R.; Zagon, M.; Lapsker, I.; Azoulay, J.; Peled, A.

    2003-01-01

    In this work direct laser writing of diffractive optical elements (DOE) by photodeposition (PD) of amorphous selenium (a-Se) from colloid solutions has been investigated. We used a computer controlled laser scanner for patterning thin film micro-profiles creating thus planar optical elements by direct beam writing on surfaces immersed in a liquid phase PD cell. The laser employed was an argon ion laser at 488 nm wavelength, with powers up to 55 mW, for writing typically 25-250 μm wide lines of 200 nm thickness at rates of about 150 μm/s. Various elements made of photodeposited thin films on polymethyl-methacrylate (PMMA) substrates were produced for prototyping microlenses, linear grating arrays, cylindrical and circular profiled DOE patterns

  3. Humidity control and hydrophilic glue coating applied to mounted protein crystals improves X-ray diffraction experiments

    International Nuclear Information System (INIS)

    Baba, Seiki; Hoshino, Takeshi; Ito, Len; Kumasaka, Takashi

    2013-01-01

    A new crystal-mounting method has been developed that involves a combination of controlled humid air and polymer glue for crystal coating. This method is particularly useful when applied to fragile protein crystals that are known to be sensitive to subtle changes in their physicochemical environment. Protein crystals are fragile, and it is sometimes difficult to find conditions suitable for handling and cryocooling the crystals before conducting X-ray diffraction experiments. To overcome this issue, a protein crystal-mounting method has been developed that involves a water-soluble polymer and controlled humid air that can adjust the moisture content of a mounted crystal. By coating crystals with polymer glue and exposing them to controlled humid air, the crystals were stable at room temperature and were cryocooled under optimized humidity. Moreover, the glue-coated crystals reproducibly showed gradual transformations of their lattice constants in response to a change in humidity; thus, using this method, a series of isomorphous crystals can be prepared. This technique is valuable when working on fragile protein crystals, including membrane proteins, and will also be useful for multi-crystal data collection

  4. Humidity control and hydrophilic glue coating applied to mounted protein crystals improves X-ray diffraction experiments

    Energy Technology Data Exchange (ETDEWEB)

    Baba, Seiki; Hoshino, Takeshi; Ito, Len; Kumasaka, Takashi, E-mail: kumasaka@spring8.or.jp [Japan Synchrotron Radiation Research Institute (JASRI/SPring-8), 1-1-1 Kouto, Sayo, Hyogo 679-5198 (Japan)

    2013-09-01

    A new crystal-mounting method has been developed that involves a combination of controlled humid air and polymer glue for crystal coating. This method is particularly useful when applied to fragile protein crystals that are known to be sensitive to subtle changes in their physicochemical environment. Protein crystals are fragile, and it is sometimes difficult to find conditions suitable for handling and cryocooling the crystals before conducting X-ray diffraction experiments. To overcome this issue, a protein crystal-mounting method has been developed that involves a water-soluble polymer and controlled humid air that can adjust the moisture content of a mounted crystal. By coating crystals with polymer glue and exposing them to controlled humid air, the crystals were stable at room temperature and were cryocooled under optimized humidity. Moreover, the glue-coated crystals reproducibly showed gradual transformations of their lattice constants in response to a change in humidity; thus, using this method, a series of isomorphous crystals can be prepared. This technique is valuable when working on fragile protein crystals, including membrane proteins, and will also be useful for multi-crystal data collection.

  5. Reflectivity and diffraction of X rays applied to organic thin films

    International Nuclear Information System (INIS)

    Rieutord, Francois

    1987-01-01

    This research thesis reports the study of organic thin films by using X-ray-based technologies, and more particularly X-ray reflectivity. After some recalls on X ray diffraction, and on the fabrication of Langmuir-Blodgett films, the author shows how, by combining three X-ray-based techniques, it is possible to study a volume structure of a thin film. He describes the technique of measurement by X- ray reflexivity, its experimental implementation, and methods for result interpretation. In the next part, the author reports the study of peculiar interference effects which are noticed in reflexivity on Langmuir-Blodgett films, and then describes the nature of these films by correlating results of X ray reflexivity with direct observations performed by electronic microscopy on replica [fr

  6. Reducing aberration effect of Fourier transform lens by modifying Fourier spectrum of diffractive optical element in beam shaping optical system.

    Science.gov (United States)

    Zhang, Fang; Zhu, Jing; Song, Qiang; Yue, Weirui; Liu, Jingdan; Wang, Jian; Situ, Guohai; Huang, Huijie

    2015-10-20

    In general, Fourier transform lenses are considered as ideal in the design algorithms of diffractive optical elements (DOEs). However, the inherent aberrations of a real Fourier transform lens disturb the far field pattern. The difference between the generated pattern and the expected design will impact the system performance. Therefore, a method for modifying the Fourier spectrum of DOEs without introducing other optical elements to reduce the aberration effect of the Fourier transform lens is proposed. By applying this method, beam shaping performance is improved markedly for the optical system with a real Fourier transform lens. The experiments carried out with a commercial Fourier transform lens give evidence for this method. The method is capable of reducing the system complexity as well as improving its performance.

  7. Precise rotational alignment of x-ray transmission diffraction gratings

    International Nuclear Information System (INIS)

    Hill, S.L.

    1988-01-01

    Gold transmission diffraction gratings used for x-ray spectroscopy must sometimes be rotationally aligned to the axis of a diagnostic instrument to within sub-milliradian accuracy. We have fabricated transmission diffraction gratings with high line-densities (grating period of 200 and 300 nm) using uv holographic and x-ray lithography. Since the submicron features of the gratings are not optically visible, precision alignment is time consuming and difficult to verify in situ. We have developed a technique to write an optically visible alignment pattern onto these gratings using a scanning electron microscope (SEM). At high magnification (15000 X) several submicron lines of the grating are observable in the SEM, making it possible to write an alignment pattern parallel to the grating lines in an electron-beam-sensitive coating that overlays the grating. We create an alignment pattern by following a 1-cm-long grating line using the SEM's joystick-controlled translation stage. By following the same grating line we are assured the traveled direction of the SEM electron beam is parallel to the grating to better than 10 μradian. The electron-beam-exposed line-width can be large (5 to 15 μm wide) depending on the SEM magnification, and is therefore optically visible. The exposed pattern is eventually made a permanent feature of the grating by ion beam etching or gold electroplating. The pattern can be used to accurately align the grating to the axis of a diagnostic instrument. More importantly, the alignment of the grating can be quickly verified in situ

  8. Developments in diffraction databases

    International Nuclear Information System (INIS)

    Jenkins, R.

    1999-01-01

    Full text: There are a number of databases available to the diffraction community. Two of the more important of these are the Powder Diffraction File (PDF) maintained by the International Centre for Diffraction Data (ICDD), and the Inorganic Crystal Structure Database (ICSD) maintained by Fachsinformationzentrum (FIZ, Karlsruhe). In application, the PDF has been used as an indispensable tool in phase identification and identification of unknowns. The ICSD database has extensive and explicit reference to the structures of compounds: atomic coordinates, space group and even thermal vibration parameters. A similar database, but for organic compounds, is maintained by the Cambridge Crystallographic Data Centre. These databases are often used as independent sources of information. However, little thought has been given on how to exploit the combined properties of structural database tools. A recently completed agreement between ICDD and FIZ, plus ICDD and Cambridge, provides a first step in complementary use of the PDF and the ICSD databases. The focus of this paper (as indicated below) is to examine ways of exploiting the combined properties of both databases. In 1996, there were approximately 76,000 entries in the PDF and approximately 43,000 entries in the ICSD database. The ICSD database has now been used to calculate entries in the PDF. Thus, to derive d-spacing and peak intensity data requires the synthesis of full diffraction patterns, i.e., we use the structural data in the ICSD database and then add instrumental resolution information. The combined data from PDF and ICSD can be effectively used in many ways. For example, we can calculate PDF data for an ideally random crystal distribution and also in the absence of preferred orientation. Again, we can use systematic studies of intermediate members in solid solutions series to help produce reliable quantitative phase analyses. In some cases, we can study how solid solution properties vary with composition and

  9. Synchrotron diffraction characterization of nanostructured KY3F10:Tb

    International Nuclear Information System (INIS)

    Ichikawa, Rodrigo U.; Teixeira, Maria I.; Ranieri, Izilda M.; Martinez, Luis G.; Linhares, Horacio M.S.M.D.; Turrillas, Xavier

    2015-01-01

    Nanostructured rare-earth fluorides materials are being intensively studied recently due to their potential applications in high-dose dosimetry. Particularly, nanostructured Tb-doped KY 3 F 10 has shown satisfactory results to be used in this area. In the present work, the structure and microstructure of KY 3 F 10 :Tb was investigated by means of X-ray synchrotron diffraction. One of the samples was analyzed as synthesized and another after a heat treatment. Rietveld refinement of synchrotron diffraction data was applied to obtain cell parameters, atomic positions and atomic displacement factors and the results were compared to values found in literature. X-ray line profile analysis methods were applied to determine mean crystallite sizes and their distribution. (author)

  10. Diffraction dissociation and elastic scattering

    International Nuclear Information System (INIS)

    Verebryusov, V.S.; Ponomarev, L.A.; Smorodinskaya, N.Ya.

    1987-01-01

    In the framework of Regge scheme with supercritical pomeron a model is suggested for the NN-scattering amplitude which takes into account the contribution introduced to the intermediate state by diffraction dissociation (DD) processes. The DD amplitude is written in terms of the Deck model which has been previously applied to describing the main DD features. The calculated NN cross sections are compared with those obtained experimentally. Theoretical predictions for higher energy are presented

  11. New software to model energy dispersive X-ray diffraction in polycrystalline materials

    Energy Technology Data Exchange (ETDEWEB)

    Ghammraoui, B., E-mail: bahaa.ghammraoui@cea.fr [CEA-Leti, MINATEC Campus, 17 rue des Martyrs, F 38054 Grenoble, Cedex 9 (France); Tabary, J. [CEA-Leti, MINATEC Campus, 17 rue des Martyrs, F 38054 Grenoble, Cedex 9 (France); Pouget, S. [CEA-INAC Sciences de la matieres, 17 rue des Martyrs, F 38054 Grenoble, Cedex 9 (France); Paulus, C.; Moulin, V.; Verger, L. [CEA-Leti, MINATEC Campus, 17 rue des Martyrs, F 38054 Grenoble, Cedex 9 (France); Duvauchelle, Ph. [CNDRI-Insa Lyon, Universite de Lyon, F-69621, Villeurbanne Cedex (France)

    2012-02-01

    Detection of illicit materials, such as explosives or drugs, within mixed samples is a major issue, both for general security and as part of forensic analyses. In this paper, we describe a new code simulating energy dispersive X-ray diffraction patterns in polycrystalline materials. This program, SinFullscat, models diffraction of any object in any diffractometer system taking all physical phenomena, including amorphous background, into account. Many system parameters can be tuned: geometry, collimators (slit and cylindrical), sample properties, X-ray source and detector energy resolution. Good agreement between simulations and experimental data was obtained. Simulations using explosive materials indicated that parameters such as the diffraction angle or the energy resolution of the detector have a significant impact on the diffraction signature of the material inspected. This software will be a convenient tool to test many diffractometer configurations, providing information on the one that best restores the spectral diffraction signature of the materials of interest.

  12. Rietveld analysis using powder diffraction data with anomalous scattering effect obtained by focused beam flat sample method

    Energy Technology Data Exchange (ETDEWEB)

    Tanaka, Masahiko, E-mail: masahiko@spring8.or.jp; Katsuya, Yoshio, E-mail: katsuya@spring8.or.jp; Sakata, Osami, E-mail: SAKATA.Osami@nims.go.jp [Synchrotron X-ray Station at SPring-8, National Institute for Materials Science 1-1-1 Kouto, Sayo, Hyogo 679-5198 (Japan)

    2016-07-27

    Focused-beam flat-sample method (FFM) is a new trial for synchrotron powder diffraction method, which is a combination of beam focusing optics, flat shape powder sample and area detectors. The method has advantages for X-ray diffraction experiments applying anomalous scattering effect (anomalous diffraction), because of 1. Absorption correction without approximation, 2. High intensity X-rays of focused incident beams and high signal noise ratio of diffracted X-rays 3. Rapid data collection with area detectors. We applied the FFM to anomalous diffraction experiments and collected synchrotron X-ray powder diffraction data of CoFe{sub 2}O{sub 4} (inverse spinel structure) using X-rays near Fe K absorption edge, which can distinguish Co and Fe by anomalous scattering effect. We conducted Rietveld analyses with the obtained powder diffraction data and successfully determined the distribution of Co and Fe ions in CoFe{sub 2}O{sub 4} crystal structure.

  13. A standardless method of quantitative ceramic analysis using X-ray powder diffraction

    International Nuclear Information System (INIS)

    Mazumdar, S.

    1999-01-01

    A new procedure using X-ray powder diffraction data for quantitative estimation of the crystalline as well as the amorphous phase in ceramics is described. Classification of the crystalline and amorphous X-ray scattering was achieved by comparison of the slopes at two successive points of the powder pattern at scattering angles at which the crystalline and amorphous phases superimpose. If the second slope exceeds the first by a stipulated value, the intensity is taken as crystalline; otherwise the scattering is considered as amorphous. Crystalline phase analysis is obtained by linear programming techniques using the concept that each observed X-ray diffraction peak has contributions from n component phases, the proportionate analysis of which is required. The method does not require the measurement of calibration data for use as an internal standard, but knowledge of the approximate crystal structure of each phase of interest in the mixture is necessary. The technique is also helpful in qualitative analysis because each suspected phase is characterized by the probability that it will be present when a reflection zone is considered in which the suspected crystalline phase could contribute. The amorphous phases are determined prior to the crystalline ones. The method is applied to ceramic materials and some results are presented. (orig.)

  14. Natural and synthetic prion structure from X-ray fiber diffraction

    Energy Technology Data Exchange (ETDEWEB)

    Wille, Holger; Bian, Wen; McDonald, Michele; Kendall, Amy; Colby, David W.; Bloch, Lillian; Ollesch, Julian; Borovinskiy, Alexander L.; Cohen, Fred E.; Prusiner, Stanley B.; Stubbs, Gerald; (Vanderbilt); (UCSF)

    2009-10-21

    A conformational isoform of the mammalian prion protein (PrP{sup Sc}) is the sole component of the infectious pathogen that causes the prion diseases. We have obtained X-ray fiber diffraction patterns from infectious prions that show cross-{beta} diffraction: meridional intensity at 4.8 {angstrom} resolution, indicating the presence of {beta} strands running approximately at right angles to the filament axis and characteristic of amyloid structure. Some of the patterns also indicated the presence of a repeating unit along the fiber axis, corresponding to four {beta}-strands. We found that recombinant (rec) PrP amyloid differs substantially from highly infectious brain-derived prions, both in structure as demonstrated by the diffraction data, and in heterogeneity as shown by electron microscopy. In addition to the strong 4.8 {angstrom} meridional reflection, the recPrP amyloid diffraction is characterized by strong equatorial intensity at approximately 10.5 {angstrom}, absent from brain-derived prions, and indicating the presence of stacked {beta}-sheets. Synthetic prions recovered from transgenic mice inoculated with recPrP amyloid displayed structural characteristics and homogeneity similar to those of naturally occurring prions. The relationship between the structural differences and prion infectivity is uncertain, but might be explained by any of several hypotheses: only a minority of recPrP amyloid possesses a replication-competent conformation, the majority of recPrP amyloid has to undergo a conformational maturation to acquire replication competency, or inhibitory forms of recPrP amyloid interfere with replication during the initial transmission.

  15. Pinhole diffraction holography for fabrication of high-resolution Fresnel zone plates.

    Science.gov (United States)

    Sarkar, Sankha S; Solak, Harun H; David, Christian; van der Veen, J Friso

    2014-01-27

    Fresnel zone plates (FZPs) play an essential role in high spatial resolution x-ray imaging and analysis of materials in many fields. These diffractive lenses are commonly made by serial writing techniques such as electron beam or focused ion beam lithography. Here we show that pinhole diffraction holography has potential to generate FZP patterns that are free from aberrations and imperfections that may be present in alternative fabrication techniques. In this presented method, FZPs are fabricated by recording interference pattern of a spherical wave generated by diffraction through a pinhole, illuminated with coherent plane wave at extreme ultraviolet (EUV) wavelength. Fundamental and practical issues involved in formation and recording of the interference pattern are considered. It is found that resolution of the produced FZP is directly related to the diameter of the pinhole used and the pinhole size cannot be made arbitrarily small as the transmission of EUV or x-ray light through small pinholes diminishes due to poor refractive index contrast found between materials in these spectral ranges. We also find that the practical restrictions on exposure time due to the light intensity available from current sources directly imposes a limit on the number of zones that can be printed with this method. Therefore a trade-off between the resolution and the FZP diameter exists. Overall, we find that this method can be used to fabricate aberration free FZPs down to a resolution of about 10 nm.

  16. Advances in X-ray powder diffraction profile analysis and its application in ceramic material studies

    International Nuclear Information System (INIS)

    Zhang, Y.

    1988-01-01

    This dissertation is concerned with the following major aspects: (1) the development of necessary computer codes to carry out X-ray powder diffraction profile analysis (XPDPA) calculations; (2) the establishment of a general reference material (GRM) which greatly extends the application of XPDPA and the study of the application of the GRM in profile analysis; (3) the determination of the coherent diffracting domain size and the lattice residual microstrain for some shock-modified and jet-milled materials. A computer code for diffraction profile refinement, XRAYL, fits a diffraction profile with any one of five mathematical functions, either as symmetric or asymmetric (split mode) forms. The resulting patterns meet the requirements for successful profile analysis of microstrain and crystallite size. Powder diffraction profile analysis requires an instrument calibration standard to correct data for instrumental profiles due to the system optics. A general reference material, LaB 6 , has been established. The pattern of this LaB 6 powder can be used to generate a reference pattern for any other substance. Through three applications, it has been shown that this LaB 6 sample can be used to remove the instrumental broadenings and gives reasonable size and strain estimates in the profile analysis of other materials. Many previous studies have shown that the solid state reactivity and physical properties of some ceramic materials can be substantially enhanced. XPDPA techniques have been used to study the plastic deformation and the reduction of crystallite size for eight shock-modified ceramic materials. The size and strain values of these materials are correlated with shock parameters

  17. Report of the Working Group on Diffractive Phenomena

    International Nuclear Information System (INIS)

    Bartel, W.; Bartels, J.W.

    1994-01-01

    The discussions in the working group on diffractive processes were structured according to a scheme, in which first the experimental basis was specified followed by a presentation of theoretical papers and a general exchange of views on diffractive phenomena. Since diffraction is observed in many different channels, a common session was organised with participants from other working groups, in particular from the photoproduction and DIS community. A total of about 20 individual contributions were presented including those of the common discussion. Not all of them will be included in the proceedings. Some speakers had contributions to different sessions and submitted only one summary paper, others presented ideas for future analysis and are still working and others were too busy to finish the write up before the deadline. Diffractive phenomena observed at HERA were presented by T. Greenshaw of H1 and T. Docker from the ZEUS collaboration. The DO results on diffraction may be looked up in G. Forden's contribution to the proceedings. Further experimental results relevant to the topic ran be found in papers by M. Costa and S. Levonian issued in the photoproduction subsection. Experimentally it is not always easy to identify diffractive processes because pion and ordinary Regge exchange contributions are also present. This question is addressed in G. Levman's paper. New ideas to exploit a similarity between gluon - and Pomeron exchange were discussed by H. Kowalski, and G. Knies proposed a thrust analysis for diffractive events. In both cases work is going on which is not yet ready for a publication. (i. Ingelman reviewed existing Mt. Carlo programs on diffractive processes like POMPYT, RAPGAP and a program based on the Nikolaev - Zakharov approach to diffraction. These programs are well documented and need no further description in these proceedings. The same argument applies to V. Fadins talk, who reviewed published results on higher order corrections to the BFKL

  18. Reciprocal space mapping by spot profile analyzing low energy electron diffraction

    International Nuclear Information System (INIS)

    Meyer zu Heringdorf, Frank-J.; Horn-von Hoegen, Michael

    2005-01-01

    We present an experimental approach for the recording of two-dimensional reciprocal space maps using spot profile analyzing low energy electron diffraction (SPA-LEED). A specialized alignment procedure eliminates the shifting of LEED patterns on the screen which is commonly observed upon variation of the electron energy. After the alignment, a set of one-dimensional sections through the diffraction pattern is recorded at different energies. A freely available software tool is used to assemble the sections into a reciprocal space map. The necessary modifications of the Burr-Brown computer interface of the two Leybold and Omicron type SPA-LEED instruments are discussed and step-by-step instructions are given to adapt the SPA 4.1d software to the changed hardware. Au induced faceting of 4 deg. vicinal Si(001) is used as an example to demonstrate the technique

  19. Ultrafast electron diffraction with megahertz MeV electron pulses from a superconducting radio-frequency photoinjector

    Energy Technology Data Exchange (ETDEWEB)

    Feng, L. W.; Lin, L.; Huang, S. L.; Quan, S. W.; Hao, J. K.; Zhu, F.; Wang, F.; Liu, K. X., E-mail: kxliu@pku.edu.cn [Institute of Heavy Ion Physics and State Key Laboratory of Nuclear Physics and Technology, Peking University, Beijing 100871 (China); Jiang, T.; Zhu, P. F.; Fu, F.; Wang, R.; Zhao, L.; Xiang, D., E-mail: dxiang@sjtu.edu.cn [Key Laboratory for Laser Plasmas (Ministry of Education), Department of Physics and Astronomy, Shanghai Jiao Tong University, Shanghai 200240 (China); IFSA Collaborative Innovation Center, Shanghai Jiao Tong University, Shanghai 200240 (China)

    2015-11-30

    We report ultrafast relativistic electron diffraction operating at the megahertz repetition rate where the electron beam is produced in a superconducting radio-frequency (rf) photoinjector. We show that the beam quality is sufficiently high to provide clear diffraction patterns from gold and aluminium samples. With the number of electrons, several orders of magnitude higher than that from a normal conducting photocathode rf gun, such high repetition rate ultrafast MeV electron diffraction may open up many new opportunities in ultrafast science.

  20. Diffractive optics and nanophotonics resolution below the diffraction limit

    CERN Document Server

    Minin, Igor

    2016-01-01

    In this book the authors present several examples of techniques used to overcome the Abby diffraction limit using flat and 3D diffractive optical elements, photonic crystal lenses, photonic jets, and surface plasmon diffractive optics. The structures discussed can be used in the microwave and THz range and also as scaled models for optical frequencies. Such nano-optical microlenses can be integrated, for example, into existing semiconductor heterostructure platforms for next-generation optoelectronic applications. Chapter 1 considers flat diffractive lenses and innovative 3D radiating structures including a conical millimeter-wave Fresnel zone plate (FZP) lens proposed for subwavelength focusing. In chapter 2 the subwavelength focusing properties of diffractive photonic crystal lenses are considered and it is shown that at least three different types of photonic crystal lens are possible.  With the aim of achieving subwavelength focusing, in chapter 3 an alternative mechanism to produce photonic jets at Tera...

  1. Three-dimensional nanostructure determination from a large diffraction data set recorded using scanning electron nanodiffraction

    Directory of Open Access Journals (Sweden)

    Yifei Meng

    2016-09-01

    Full Text Available A diffraction-based technique is developed for the determination of three-dimensional nanostructures. The technique employs high-resolution and low-dose scanning electron nanodiffraction (SEND to acquire three-dimensional diffraction patterns, with the help of a special sample holder for large-angle rotation. Grains are identified in three-dimensional space based on crystal orientation and on reconstructed dark-field images from the recorded diffraction patterns. Application to a nanocrystalline TiN thin film shows that the three-dimensional morphology of columnar TiN grains of tens of nanometres in diameter can be reconstructed using an algebraic iterative algorithm under specified prior conditions, together with their crystallographic orientations. The principles can be extended to multiphase nanocrystalline materials as well. Thus, the tomographic SEND technique provides an effective and adaptive way of determining three-dimensional nanostructures.

  2. Towards a full retrieval of the deformation tensor F using convergent beam electron diffraction

    Energy Technology Data Exchange (ETDEWEB)

    Martin, Y. [CEA, INAC-SP2M, LEMMA, F-38000 Grenoble (France); Univ. Grenoble Alpes, INAC-SP2M, F-38000 Grenoble (France); Rouviere, J.L., E-mail: jean-luc.rouviere@cea.fr [CEA, INAC-SP2M, LEMMA, F-38000 Grenoble (France); Univ. Grenoble Alpes, INAC-SP2M, F-38000 Grenoble (France); Zuo, J.M. [Department of Material Science and Engineering and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL 61801 (United States); Favre-Nicolin, V. [Univ. Grenoble Alpes, INAC-SP2M, F-38000 Grenoble (France); CEA, INAC-SP2M, LEMMA, F-38000 Grenoble (France)

    2016-01-15

    A new method to retrieve the local lattice parameters and rotations in a crystal from off-axis convergent beam electron diffraction (CBED) patterns is presented and validated using Bloch wave dynamical simulations. The originality of the method is to use both the diffracted and transmitted beams and to use kinematical approximations in the fitting algorithm. The study is based on the deformation gradient tensor F which includes rotation and strain. Working on simulated images it is shown that (i) from a single direction of observation, seven parameters out of the nine parameters of F can be determined with an accuracy of 3×10{sup −4} for the normal strain parameters ε{sub xx}, ε{sub yy}, and ε{sub zz}, (ii) the unit cell volume can only be retrieved if the diffracted and transmitted beams are both included in the fitting and (iii) all the nine parameters of F can be determined by combining two directions of observation separated by about 20°. - Highlights: • New CBED strain retrieval method using both deficient and excess HOLZ lines. • From a single CBED pattern, the unit cell volume can be measured without ambiguity. • From a single pattern, seven parameters of the deformation tensor F can be determined. • From two patterns from two directions separated by 20°, the nine parameters are retrieved. • Algorithm validated using dynamical simulations.

  3. Conical diffraction as a versatile building block to implement new imaging modalities for superresolution in fluorescence microscopy

    Science.gov (United States)

    Fallet, Clément; Caron, Julien; Oddos, Stephane; Tinevez, Jean-Yves; Moisan, Lionel; Sirat, Gabriel Y.; Braitbart, Philippe O.; Shorte, Spencer L.

    2014-08-01

    We present a new technology for super-resolution fluorescence imaging, based on conical diffraction. Conical diffraction is a linear, singular phenomenon taking place when a polarized beam is diffracted through a biaxial crystal. The illumination patterns generated by conical diffraction are more compact than the classical Gaussian beam; we use them to generate a super-resolution imaging modality. Conical Diffraction Microscopy (CODIM) resolution enhancement can be achieved with any type of objective on any kind of sample preparation and standard fluorophores. Conical diffraction can be used in multiple fashion to create new and disruptive technologies for super-resolution microscopy. This paper will focus on the first one that has been implemented and give a glimpse at what the future of microscopy using conical diffraction could be.

  4. Temperature gradient method for lipid phase diagram construction using time-resolved x-ray diffraction

    International Nuclear Information System (INIS)

    Caffrey, M.; Hing, F.S.

    1987-01-01

    A method that enables temperature-composition phase diagram construction at unprecedented rates is described and evaluated. The method involves establishing a known temperature gradient along the length of a metal rod. Samples of different compositions contained in long, thin-walled capillaries are positioned lengthwise on the rod and equilibrated such that the temperature gradient is communicated into the sample. The sample is then moved through a focused, monochromatic synchrotron-derived x-ray beam and the image-intensified diffraction pattern from the sample is recorded on videotape continuously in live-time as a function of position and, thus, temperature. The temperature at which the diffraction pattern changes corresponds to a phase boundary, and the phase(s) existing (coexisting) on either side of the boundary can be identified on the basis of the diffraction pattern. Repeating the measurement on samples covering the entire composition range completes the phase diagram. These additional samples can be conveniently placed at different locations around the perimeter of the cylindrical rod and rotated into position for diffraction measurement. Temperature-composition phase diagrams for the fully hydrated binary mixtures, dimyristoylphosphatidylcholine (DMPC)/dipalmitoylphosphatidylcholine (DPPC) and dipalmitoylphosphatidylethanolamine (DPPE)/DPPC, have been constructed using the new temperature gradient method. They agree well with and extend the results obtained by other techniques. In the DPPE/DPPC system structural parameters as a function of temperature in the various phases including the subgel phase are reported. The potential limitations of this steady-state method are discussed

  5. Monitoring protein precipitates by in-house X-ray powder diffraction

    DEFF Research Database (Denmark)

    Ståhl, Kenny; Frankær, Christian Grundahl; Petersen, Jakob

    2013-01-01

    of such calculated powder patterns from insulin and lysozyme have been included in the powder diffraction database and successfully used for search-match identification. However, the fit could be much improved if peak asymmetry and multiple bulk-solvent corrections were included. When including a large number...

  6. A Dictionary Approach to Electron Backscatter Diffraction Indexing.

    Science.gov (United States)

    Chen, Yu H; Park, Se Un; Wei, Dennis; Newstadt, Greg; Jackson, Michael A; Simmons, Jeff P; De Graef, Marc; Hero, Alfred O

    2015-06-01

    We propose a framework for indexing of grain and subgrain structures in electron backscatter diffraction patterns of polycrystalline materials. We discretize the domain of a dynamical forward model onto a dense grid of orientations, producing a dictionary of patterns. For each measured pattern, we identify the most similar patterns in the dictionary, and identify boundaries, detect anomalies, and index crystal orientations. The statistical distribution of these closest matches is used in an unsupervised binary decision tree (DT) classifier to identify grain boundaries and anomalous regions. The DT classifies a pattern as an anomaly if it has an abnormally low similarity to any pattern in the dictionary. It classifies a pixel as being near a grain boundary if the highly ranked patterns in the dictionary differ significantly over the pixel's neighborhood. Indexing is accomplished by computing the mean orientation of the closest matches to each pattern. The mean orientation is estimated using a maximum likelihood approach that models the orientation distribution as a mixture of Von Mises-Fisher distributions over the quaternionic three sphere. The proposed dictionary matching approach permits segmentation, anomaly detection, and indexing to be performed in a unified manner with the additional benefit of uncertainty quantification.

  7. A 3D implementation of ray tracing combined with diffraction on facets: Verification and a potential application

    International Nuclear Information System (INIS)

    Clarke, Adrian J.M.; Hesse, Evelyn; Ulanowski, Zbigniew; Kaye, Paul H.

    2006-01-01

    A 3D implementation of a new model of light scattering applicable to dielectric faceted objects is introduced. The model combines standard geometric optics with diffraction on individual facets. It can be applied to any faceted geometry. The model adds no significant computational overheads to classical geometric optics yet provides much improved results. Initial results for long hexagonal columns are compared to SVM and appear favourable. 2D scattering patterns are calculated for a hexagonal column in a fixed orientation and compared to those created by ice analogue crystals in the laboratory with close agreement. The comparison includes the observation of a guided wave propagating along the length of the column. The new model is then applied to a selection of geometries to illustrate how it could be used to aid particle characterization, particularly in the case of cirrus ice

  8. The geometrical theory of diffraction for axially symmetric reflectors

    DEFF Research Database (Denmark)

    Rusch, W.; Sørensen, O.

    1975-01-01

    The geometrical theory of diffraction (GTD) (cf. [1], for example) may be applied advantageously to many axially symmetric reflector antenna geometries. The material in this communication presents analytical, computational, and experimental results for commonly encountered reflector geometries...

  9. Evaluation of In-Vacuum Imaging Plate Detector for X-Ray Diffraction Microscopy

    International Nuclear Information System (INIS)

    Nishino, Yoshinori; Takahashi, Yukio; Yamamoto, Masaki; Ishikawa, Tetsuya

    2007-01-01

    We performed evaluation tests of a newly developed in-vacuum imaging plate (IP) detector for x-ray diffraction microscopy. IP detectors have advantages over direct x-ray detection charge-coupled device (CCD) detectors, which have been commonly used in x-ray diffraction microscopy experiments, in the capabilities for a high photon count and for a wide area. The detector system contains two IPs to make measurement efficient by recording data with the one while reading or erasing the other. We compared speckled diffraction patterns of single particles taken with the IP and a direct x-ray detection CCD. The IP was inferior to the CCD in spatial resolution and in signal-to-noise ratio at a low photon count

  10. Generalized diffraction-stack migration and filtering of coherent noise

    KAUST Repository

    Zhan, Ge

    2014-01-27

    We reformulate the equation of reverse-time migration so that it can be interpreted as summing data along a series of hyperbola-like curves, each one representing a different type of event such as a reflection or multiple. This is a generalization of the familiar diffraction-stack migration algorithm where the migration image at a point is computed by the sum of trace amplitudes along an appropriate hyperbola-like curve. Instead of summing along the curve associated with the primary reflection, the sum is over all scattering events and so this method is named generalized diffraction-stack migration. This formulation leads to filters that can be applied to the generalized diffraction-stack migration operator to mitigate coherent migration artefacts due to, e.g., crosstalk and aliasing. Results with both synthetic and field data show that generalized diffraction-stack migration images have fewer artefacts than those computed by the standard reverse-time migration algorithm. The main drawback is that generalized diffraction-stack migration is much more memory intensive and I/O limited than the standard reverse-time migration method. © 2014 European Association of Geoscientists & Engineers.

  11. Abstracts of International Conference on Experimental and Computing Methods in High Resolution Diffraction Applied for Structure Characterization of Modern Materials - HREDAMM

    International Nuclear Information System (INIS)

    2004-01-01

    The conference addressed all aspects of high resolution diffraction. The topics of meeting include advanced experimental diffraction methods and computer data analysis for characterization of modern materials as well as the progress and new achievements in high resolution diffraction (X-ray, electrons, neutrons). Application of these methods for characterization of modern materials are widely presented among the invited, oral and poster contributions

  12. Determination of Ni(II) crystal structure by powder x-ray diffraction ...

    African Journals Online (AJOL)

    X-ray powder diffraction pattern was used to determine the length of the unit cell, “a”, the lattice structure type, and the number of atoms per unit cell of Ni(II) crystal. The “a” value was determined to be 23.66 ± 0.005 Å, particle size of 34.87 nm, volume 13.24 Å and Strain value ε = 9.8 x 10-3. The cell search on PXRD patterns ...

  13. submitter Digital Image Correlation of 2D X-ray Powder Diffraction Data for Lattice Strain Evaluation

    CERN Document Server

    Zhang, Hongjia; Salvati, Enrico; Daisenberger, Dominik; Lunt, Alexander J G; Fong, Kai Soon; Song, Xu; Korsunsky, Alexander M

    2018-01-01

    High energy 2D X-ray powder diffraction experiments are widely used for lattice strain measurement. The 2D to 1D conversion of diffraction patterns is a necessary step used to prepare the data for full pattern refinement, but is inefficient when only peak centre position information is required for lattice strain evaluation. The multi-step conversion process is likely to lead to increased errors associated with the ‘caking’ (radial binning) or fitting procedures. A new method is proposed here that relies on direct Digital Image Correlation analysis of 2D X-ray powder diffraction patterns (XRD-DIC, for short). As an example of using XRD-DIC, residual strain values along the central line in a Mg AZ31B alloy bar after 3-point bending are calculated by using both XRD-DIC and the conventional ‘caking’ with fitting procedures. Comparison of the results for strain values in different azimuthal angles demonstrates excellent agreement between the two methods. The principal strains and directions are calculated...

  14. Time-resolved x-ray diffraction techniques for bulk polycrystalline materials under dynamic loading

    Energy Technology Data Exchange (ETDEWEB)

    Lambert, P. K.; Hustedt, C. J.; Zhao, M.; Ananiadis, A. G.; Hufnagel, T. C. [Department of Materials Science and Engineering, Johns Hopkins University, Baltimore, Maryland 21218 (United States); Vecchio, K. S. [Department of NanoEngineering, University of California San Diego, La Jolla, California 92093 (United States); Huskins, E. L. [Oak Ridge Institute for Science and Education, Oak Ridge, Tennessee 37830 (United States); US Army Research Laboratory, Aberdeen Proving Ground, Aberdeen, Maryland 21005 (United States); Casem, D. T. [US Army Research Laboratory, Aberdeen Proving Ground, Aberdeen, Maryland 21005 (United States); Gruner, S. M. [Department of Physics, Cornell University, Ithaca, New York 14853 (United States); Cornell High Energy Synchrotron Source (CHESS), Cornell University, Ithaca, New York 14853 (United States); Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, New York 14853 (United States); Tate, M. W.; Philipp, H. T.; Purohit, P.; Weiss, J. T. [Department of Physics, Cornell University, Ithaca, New York 14853 (United States); Woll, A. R. [Cornell High Energy Synchrotron Source (CHESS), Cornell University, Ithaca, New York 14853 (United States); Kannan, V.; Ramesh, K. T. [Department of Mechanical Engineering, Johns Hopkins University, Baltimore, Maryland 21218 (United States); Kenesei, P.; Okasinski, J. S.; Almer, J. [X-ray Science Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)

    2014-09-15

    We have developed two techniques for time-resolved x-ray diffraction from bulk polycrystalline materials during dynamic loading. In the first technique, we synchronize a fast detector with loading of samples at strain rates of ∼10{sup 3}–10{sup 4} s{sup −1} in a compression Kolsky bar (split Hopkinson pressure bar) apparatus to obtain in situ diffraction patterns with exposures as short as 70 ns. This approach employs moderate x-ray energies (10–20 keV) and is well suited to weakly absorbing materials such as magnesium alloys. The second technique is useful for more strongly absorbing materials, and uses high-energy x-rays (86 keV) and a fast shutter synchronized with the Kolsky bar to produce short (∼40 μs) pulses timed with the arrival of the strain pulse at the specimen, recording the diffraction pattern on a large-format amorphous silicon detector. For both techniques we present sample data demonstrating the ability of these techniques to characterize elastic strains and polycrystalline texture as a function of time during high-rate deformation.

  15. Diffraction-Induced Bidimensional Talbot Self-Imaging with Full Independent Period Control

    Science.gov (United States)

    Guillet de Chatellus, Hugues; Romero Cortés, Luis; Deville, Antonin; Seghilani, Mohamed; Azaña, José

    2017-03-01

    We predict, formulate, and observe experimentally a generalized version of the Talbot effect that allows one to create diffraction-induced self-images of a periodic two-dimensional (2D) waveform with arbitrary control of the image spatial periods. Through the proposed scheme, the periods of the output self-image are multiples of the input ones by any desired integer or fractional factor, and they can be controlled independently across each of the two wave dimensions. The concept involves conditioning the phase profile of the input periodic wave before free-space diffraction. The wave energy is fundamentally preserved through the self-imaging process, enabling, for instance, the possibility of the passive amplification of the periodic patterns in the wave by a purely diffractive effect, without the use of any active gain.

  16. Origin of nondetectable x-ray diffraction peaks in nanocomposite CuTiZr alloys

    DEFF Research Database (Denmark)

    Jiang, Jianzhong; Kato, H.; Ohsuna, T.

    2003-01-01

    Microscopic structures of Cu60Ti10+xZr30-x (x=0 and 10) alloys have been investigated by transmission electron microscopy, x-ray diffraction (XRD) and differential scanning calorimeter (DSC). In the Cu60Ti10Zr30 samples annealed at 708 K for times ranging from 0 to 130 min, where the enthalpy...... of the first exothermic peak decreases by 80%, the corresponding XRD patterns still look similar to that for the as-prepared sample. However, the simulated XRD patterns for the pure Cu51Zr14 phase, which is the crystalline phase formed during the first exothermic reaction, with small grain sizes and defects...... clearly show a broadened amorphous-like feature. This might be the reason that no diffraction peaks from the nanocrystalline component were detected in the XRD patterns recorded for the as-cast or as-spun Cu60Ti10+xZr30-x (x=0 and 10) alloys and for the alloys annealed at lower temperatures, in which...

  17. Application of a particular class of integrals in the theory of diffraction

    Energy Technology Data Exchange (ETDEWEB)

    Kamishi, Burim, E-mail: burim.kamishi@uni-pr.edu; Bejtullahu, Rasim [Faculty of Natural Sciences and Mathematics, University of Prishtina, Prishtina, Kosovo (Country Unknown); Sykja, Halil [Faculty of Natural Sciences, University of Tirana, Tirana (Albania)

    2016-03-25

    A particular class of integrals appearing in the problems of diffraction is treated in this paper. For the analysis of the classical sources or lasers, Kirchhoff’s integral can be used only for apertures of a determined shape. So far, the problems are solved and analyzed completely, whenever the geomtry of apertures creates the possibility of using Kirchhoff’s integral, namely for the so-called geometry of rectangular apertures. Other apertures exist for which Kirchhoff’s integral cannot be applied, because of difficulties of mathematical character. In this group of apertures belong all the apertures which are bounded with an inclined line, such as those with triangular form. In this paper, the application of a particular class of integrals is shown to give satisfying results in two problems of diffraction theory: double-diffraction phenomena consisting on separating the interferential-diffractional field from the diffractional field, and the case of near-zone of diffraction in the triangular aperture.

  18. Theoretical study of noble gases diffraction from Ru(0001) using van der Waals DFT-based potentials

    International Nuclear Information System (INIS)

    Del Cueto, M; Muzas, A S; Martín, F; Díaz, C

    2015-01-01

    This study aims to analyze the role of van der Waals forces in the diffraction process of noble gases from a metal surface. We made use of different vdW implementations to rationalize the effect of dispersion forces on the corrugation of the system, the resulting scattering patterns and on the eventual diffraction results. (paper)

  19. Diffractive interactions

    International Nuclear Information System (INIS)

    Del Duca, V.; Marage, P.

    1996-08-01

    The general framework of diffractive deep inelastic scattering is introduced and reports given in the session on diffractive interactions at the international workshop on deep-inelastic scattering and related phenomena, Rome, April 1996, are presented. (orig.)

  20. Can Link Analysis Be Applied to Identify Behavioral Patterns in Train Recorder Data?

    Science.gov (United States)

    Strathie, Ailsa; Walker, Guy H

    2016-03-01

    A proof-of-concept analysis was conducted to establish whether link analysis could be applied to data from on-train recorders to detect patterns of behavior that could act as leading indicators of potential safety issues. On-train data recorders capture data about driving behavior on thousands of routine journeys every day and offer a source of untapped data that could be used to offer insights into human behavior. Data from 17 journeys undertaken by six drivers on the same route over a 16-hr period were analyzed using link analysis, and four key metrics were examined: number of links, network density, diameter, and sociometric status. The results established that link analysis can be usefully applied to data captured from on-vehicle recorders. The four metrics revealed key differences in normal driver behavior. These differences have promising construct validity as leading indicators. Link analysis is one method that could be usefully applied to exploit data routinely gathered by on-vehicle data recorders. It facilitates a proactive approach to safety based on leading indicators, offers a clearer understanding of what constitutes normal driving behavior, and identifies trends at the interface of people and systems, which is currently a key area of strategic risk. These research findings have direct applications in the field of transport data monitoring. They offer a means of automatically detecting patterns in driver behavior that could act as leading indicators of problems during operation and that could be used in the proactive monitoring of driver competence, risk management, and even infrastructure design. © 2015, Human Factors and Ergonomics Society.

  1. Neutron diffraction study of history dependence in MnFeP0.6Si0.4

    International Nuclear Information System (INIS)

    Zhang, L.; Moze, O.; Prokes, K.; Tegus, O.; Brueck, E.

    2005-01-01

    In the MnFe(P,As) compounds which are promising magnetorefrigerant materials, we have studied the effect of Si substitution and successfully replaced As by Si. Surprisingly besides all the other changes, a peculiar history dependence of the magnetic phase transition was disclosed. The as-prepared sample shows a significantly lower transition temperature (namely a virgin T C ) than the sample that has experienced thermal cycling. The neutron diffraction patterns recorded during the first cooling manifest the first-order and magnetic-field-induced characters of the virgin phase transition. However, the refinement of the diffraction patterns does not provide evidence for atomic-position swapping, which might account for this history dependence

  2. Amplitude-phase characteristics of electromagnetic fields diffracted by a hole in a thin film with realistic optical properties

    Science.gov (United States)

    Dorofeyev, Illarion

    2009-03-01

    Characteristics of a quasi-spherical wave front of an electromagnetic field diffracted by a subwavelength hole in a thin film with real optical properties are studied. Related diffraction problem is solved in general by use of the scalar and vector Green's theorems and related Green's function of a boundary-value problem. Local phase deviations of a diffracted wave front from an ideal spherical front are calculated. Diffracted patterns are calculated for the coherent incident fields in case of holes array in a screen of perfect conductivity.

  3. Diffraction coherence in optics

    CERN Document Server

    Françon, M; Green, L L

    2013-01-01

    Diffraction: Coherence in Optics presents a detailed account of the course on Fraunhofer diffraction phenomena, studied at the Faculty of Science in Paris. The publication first elaborates on Huygens' principle and diffraction phenomena for a monochromatic point source and diffraction by an aperture of simple form. Discussions focus on diffraction at infinity and at a finite distance, simplified expressions for the field, calculation of the path difference, diffraction by a rectangular aperture, narrow slit, and circular aperture, and distribution of luminous flux in the airy spot. The book th

  4. X-ray diffraction analysis of InAs nanowires

    International Nuclear Information System (INIS)

    Davydok, Anton

    2013-01-01

    Semiconductor nanowires have attracted great interest as building blocks for future electronic and optoelectronic devices. The variability of the growth process opens the opportunity to control and combine the various properties tailoring for specific application. It was shown that the electrical and optical characteristics of the nanowires are strongly connected with their structure. Despite intensive research in this field, the growth process is still not fully understood. In particular, extensive real structure investigations are required. Most of the reports dedicated on the structural researches are based on the results of scanning electron microscopy (SEM) or transmission electron microscopy (TEM). SEM provides an image of the surface with nanostructures and is mainly used to describe the morphology of the sample, but it does not bring information about the internal structure, phase composition and defect structure. At the same time, the internal structure can be examined by TEM down to atomic scale. TEM image of good quality are very expensive due to the efforts in sample preparation and in localisation of a single object. All these aspects make the statistical structural analysis difficult. In the present work, X-ray diffraction analysis has been applied for structural investigation of InAs nanowires grown by different techniques. Using various X-ray diffraction geometries, the nanowire systems were investigated in terms of the lattice parameters, phase composition, strains and displacement fields and stacking defects. In particular, realizing grazing incidence diffraction and controlling the penetration depth of X-ray beam, we characterized sample series grown by Au-assisted metal organic phase epitaxy on GaAs [111]B substrate with different growth time. According to the results of SEM and X-ray investigations, a model of the growth process has been proposed. A more detailed analysis was performed on InAs nanowires grown by molecular beam epitaxy (MBE) on

  5. Determination of the hexagonal network parameters of the quartz β using neutron multiple diffraction

    International Nuclear Information System (INIS)

    Campos, L.C.; Parente, C.B.R.; Mazzocchi, V.L.; Helene, O.

    2000-01-01

    In this work, neutron multiple diffraction is employed for the determination of the parameters a and c of the β-quartz hexagonal cell. This crystalline phase of silica (SiO 2 ) occurs in temperatures between ca. 846 and 1143 K. A β-quartz neutron multiple diffraction pattern has been used in the determinations. This pattern was obtained with a natural quartz single crystal heated to 1003 K. During the indexing of the pattern it was verified that most of the pairs of secondary reflections, which are responsible for the formation of peaks, could be classified as 'good for the determination of a' or 'good for the determination of c'. With this classification, it became possible to employ an iterative method for the determination of both parameters. After 8 cycles of iteration the values found for the parameters were a = 4.9964 +- 0.0018 and c = 5.46268 +- 0.00052 A. (author)

  6. ATALANTA: a multicomponent pulsed neutron diffraction analysis code

    International Nuclear Information System (INIS)

    Benham, M.J.; Ross, D.K.

    1986-01-01

    The analysis of powder diffraction patterns from metal hydrogen systems present certain problems which have been addressed in a restructured profile analysis program. The heart of this program, ATALANTA, is a routine which locates and processes small sections of the data field to which a minimal number of Bragg peaks contribute intensity. The analysis of a three component test data set is presented in order to demonstrate the method. (author)

  7. JMFA2—a graphically interactive Java program that fits microfibril angle X-ray diffraction data

    Science.gov (United States)

    Steve P. Verrill; David E. Kretschmann; Victoria L. Herian

    2006-01-01

    X-ray diffraction techniques have the potential to decrease the time required to determine microfibril angles dramatically. In this paper, we discuss the latest version of a curve-fitting toll that permits us to reduce the time required to evaluate MFA X-ray diffraction patterns. Further, because this tool reflects the underlying physics more accurately than existing...

  8. A new theory for X-ray diffraction.

    Science.gov (United States)

    Fewster, Paul F

    2014-05-01

    This article proposes a new theory of X-ray scattering that has particular relevance to powder diffraction. The underlying concept of this theory is that the scattering from a crystal or crystallite is distributed throughout space: this leads to the effect that enhanced scatter can be observed at the `Bragg position' even if the `Bragg condition' is not satisfied. The scatter from a single crystal or crystallite, in any fixed orientation, has the fascinating property of contributing simultaneously to many `Bragg positions'. It also explains why diffraction peaks are obtained from samples with very few crystallites, which cannot be explained with the conventional theory. The intensity ratios for an Si powder sample are predicted with greater accuracy and the temperature factors are more realistic. Another consequence is that this new theory predicts a reliability in the intensity measurements which agrees much more closely with experimental observations compared to conventional theory that is based on `Bragg-type' scatter. The role of dynamical effects (extinction etc.) is discussed and how they are suppressed with diffuse scattering. An alternative explanation for the Lorentz factor is presented that is more general and based on the capture volume in diffraction space. This theory, when applied to the scattering from powders, will evaluate the full scattering profile, including peak widths and the `background'. The theory should provide an increased understanding of the reliability of powder diffraction measurements, and may also have wider implications for the analysis of powder diffraction data, by increasing the accuracy of intensities predicted from structural models.

  9. DNA hydration studied by neutron fiber diffraction

    Energy Technology Data Exchange (ETDEWEB)

    Fuller, W.; Forsyth, V.T.; Mahendrasingam, A.; Langan, P.; Pigram, W.J. [Keele Univ. (United Kingdom)] [and others

    1994-12-31

    The development of neutron high angle fiber diffraction to investigate the location of water around the deoxyribonucleic acid (DNA) double-helix is described. The power of the technique is illustrated by its application to the D and A conformations of DNA using the single crystal diffractometer, D19, at the Institute Laue-Langevin, Grenoble and the time of flight diffractometer, SXD, at the Rutherford Appleton ISIS Spallation Neutron Source. These studies show the existence of bound water closely associated with the DNA. The patterns of hydration in these two DNA conformations are quite distinct and are compared to those observed in X-ray single crystal studies of two-stranded oligodeoxynucleotides. Information on the location of water around the DNA double-helix from the neutron fiber diffraction studies is combined with that on the location of alkali metal cations from complementary X-ray high angle fiber diffraction studies at the Daresbury Laboratory SRS using synchrotron radiation. These analyses emphasize the importance of viewing DNA, water and ions as a single system with specific interactions between the three components and provide a basis for understanding the effect of changes in the concentration of water and ions in inducing conformations] transitions in the DNA double-helix.

  10. DNA hydration studied by neutron fiber diffraction

    International Nuclear Information System (INIS)

    Fuller, W.; Forsyth, V.T.; Mahendrasingam, A.; Langan, P.; Pigram, W.J.

    1994-01-01

    The development of neutron high angle fiber diffraction to investigate the location of water around the deoxyribonucleic acid (DNA) double-helix is described. The power of the technique is illustrated by its application to the D and A conformations of DNA using the single crystal diffractometer, D19, at the Institute Laue-Langevin, Grenoble and the time of flight diffractometer, SXD, at the Rutherford Appleton ISIS Spallation Neutron Source. These studies show the existence of bound water closely associated with the DNA. The patterns of hydration in these two DNA conformations are quite distinct and are compared to those observed in X-ray single crystal studies of two-stranded oligodeoxynucleotides. Information on the location of water around the DNA double-helix from the neutron fiber diffraction studies is combined with that on the location of alkali metal cations from complementary X-ray high angle fiber diffraction studies at the Daresbury Laboratory SRS using synchrotron radiation. These analyses emphasize the importance of viewing DNA, water and ions as a single system with specific interactions between the three components and provide a basis for understanding the effect of changes in the concentration of water and ions in inducing conformations] transitions in the DNA double-helix

  11. Whole-pattern fitting technique in serial femtosecond nanocrystallography

    Directory of Open Access Journals (Sweden)

    Ruben A. Dilanian

    2016-03-01

    Full Text Available Serial femtosecond X-ray crystallography (SFX has created new opportunities in the field of structural analysis of protein nanocrystals. The intensity and timescale characteristics of the X-ray free-electron laser sources used in SFX experiments necessitate the analysis of a large collection of individual crystals of variable shape and quality to ultimately solve a single, average crystal structure. Ensembles of crystals are commonly encountered in powder diffraction, but serial crystallography is different because each crystal is measured individually and can be oriented via indexing and merged into a three-dimensional data set, as is done for conventional crystallography data. In this way, serial femtosecond crystallography data lie in between conventional crystallography data and powder diffraction data, sharing features of both. The extremely small sizes of nanocrystals, as well as the possible imperfections of their crystallite structure, significantly affect the diffraction pattern and raise the question of how best to extract accurate structure-factor moduli from serial crystallography data. Here it is demonstrated that whole-pattern fitting techniques established for one-dimensional powder diffraction analysis can be feasibly extended to higher dimensions for the analysis of merged SFX diffraction data. It is shown that for very small crystals, whole-pattern fitting methods are more accurate than Monte Carlo integration methods that are currently used.

  12. Polymerization speed and diffractive experiments in polymer network LC test cells

    Science.gov (United States)

    Braun, Larissa; Gong, Zhen; Habibpourmoghadam, Atefeh; Schafforz, Samuel L.; Wolfram, Lukas; Lorenz, Alexander

    2018-02-01

    Polymer-network liquid crystals (LCs), where the response properties of a LC can be enhanced by the presence of a porous polymer network, are investigated. In the reported experiments, liquid crystals were doped with a small amount (situ generated polymer network, the electro-optic response properties of photo cured samples were enhanced. For example, their continuous phase modulation properties led to more localized responses in samples with interdigitated electrodes, which caused suppression of selected diffraction orders in the diffraction patterns recorded in polymer network LC samples. Moreover, capacitance changes were investigated during photopolymerization of a blue phase LC.

  13. Diffraction, self-focusing, and the geometrical optics limit in laser produced plasmas

    International Nuclear Information System (INIS)

    Marchand, R.; Rankin, R.; Capjack, C.E.; Birnboim, A.

    1987-01-01

    The effect of diffraction on the self-modulation of an intense laser beam in an initially uniform hydrogen plasma is investigated. A formalism is used in which the diffraction term in the paraxial wave equation can be arbitrarily reduced by the use of a weight factor iota. In the limit where iota approaches zero, it is shown that the paraxial wave equation correctly reduces to the geometrical optics limit and that the problem then becomes formally equivalent to solving the ray-tracing equations. When iota = 1, the paraxial wave equation takes its usual form and diffraction is fully accounted for. This formalism is applied to the simulation of self-modulation of an intense laser beam in a hydrogen plasma, for which diffraction is shown to be significant

  14. A pipeline for comprehensive and automated processing of electron diffraction data in IPLT.

    Science.gov (United States)

    Schenk, Andreas D; Philippsen, Ansgar; Engel, Andreas; Walz, Thomas

    2013-05-01

    Electron crystallography of two-dimensional crystals allows the structural study of membrane proteins in their native environment, the lipid bilayer. Determining the structure of a membrane protein at near-atomic resolution by electron crystallography remains, however, a very labor-intense and time-consuming task. To simplify and accelerate the data processing aspect of electron crystallography, we implemented a pipeline for the processing of electron diffraction data using the Image Processing Library and Toolbox (IPLT), which provides a modular, flexible, integrated, and extendable cross-platform, open-source framework for image processing. The diffraction data processing pipeline is organized as several independent modules implemented in Python. The modules can be accessed either from a graphical user interface or through a command line interface, thus meeting the needs of both novice and expert users. The low-level image processing algorithms are implemented in C++ to achieve optimal processing performance, and their interface is exported to Python using a wrapper. For enhanced performance, the Python processing modules are complemented with a central data managing facility that provides a caching infrastructure. The validity of our data processing algorithms was verified by processing a set of aquaporin-0 diffraction patterns with the IPLT pipeline and comparing the resulting merged data set with that obtained by processing the same diffraction patterns with the classical set of MRC programs. Copyright © 2013 Elsevier Inc. All rights reserved.

  15. Dynamic diffraction-limited light-coupling of 3D-maneuvered wave-guided optical waveguides.

    Science.gov (United States)

    Villangca, Mark; Bañas, Andrew; Palima, Darwin; Glückstad, Jesper

    2014-07-28

    We have previously proposed and demonstrated the targeted-light delivery capability of wave-guided optical waveguides (WOWs). As the WOWs are maneuvered in 3D space, it is important to maintain efficient light coupling through the waveguides within their operating volume. We propose the use of dynamic diffractive techniques to create diffraction-limited spots that will track and couple to the WOWs during operation. This is done by using a spatial light modulator to encode the necessary diffractive phase patterns to generate the multiple and dynamic coupling spots. The method is initially tested for a single WOW and we have experimentally demonstrated dynamic tracking and coupling for both lateral and axial displacements.

  16. Dynamic diffraction-limited light-coupling of 3D-maneuvered wave-guided optical waveguides

    DEFF Research Database (Denmark)

    Villangca, Mark Jayson; Bañas, Andrew Rafael; Palima, Darwin

    2014-01-01

    We have previously proposed and demonstrated the targeted-light delivery capability of wave-guided optical waveguides (WOWs). As the WOWs are maneuvered in 3D space, it is important to maintain efficient light coupling through the waveguides within their operating volume. We propose the use...... of dynamic diffractive techniques to create diffraction-limited spots that will track and couple to the WOWs during operation. This is done by using a spatial light modulator to encode the necessary diffractive phase patterns to generate the multiple and dynamic coupling spots. The method is initially tested...... for a single WOW and we have experimentally demonstrated dynamic tracking and coupling for both lateral and axial displacements....

  17. Evaluation of domain randomness in periodically poled lithium niobate by diffraction noise measurement.

    Science.gov (United States)

    Dwivedi, Prashant Povel; Choi, Hee Joo; Kim, Byoung Joo; Cha, Myoungsik

    2013-12-16

    Random duty-cycle errors (RDE) in ferroelectric quasi-phase-matching (QPM) devices not only affect the frequency conversion efficiency, but also generate non-phase-matched parasitic noise that can be detrimental to some applications. We demonstrate an accurate but simple method for measuring the RDE in periodically poled lithium niobate. Due to the equivalence between the undepleted harmonic generation spectrum and the diffraction pattern from the QPM grating, we employed linear diffraction measurement which is much simpler than tunable harmonic generation experiments [J. S. Pelc, et al., Opt. Lett.36, 864-866 (2011)]. As a result, we could relate the RDE for the QPM device to the relative noise intensity between the diffraction orders.

  18. Optimization of the temporal pattern of applied dose for a single fraction of radiation: Implications for radiation therapy

    Science.gov (United States)

    Altman, Michael B.

    The increasing prevalence of intensity modulated radiation therapy (IMRT) as a treatment modality has led to a renewed interest in the potential for interaction between prolonged treatment time, as frequently associated with IMRT, and the underlying radiobiology of the irradiated tissue. A particularly relevant aspect of radiobiology is cell repair capacity, which influences cell survival, and thus directly relates to the ability to control tumors and spare normal tissues. For a single fraction of radiation, the linear quadratic (LQ) model is commonly used to relate the radiation dose to the fraction of cells surviving. The LQ model implies a dependence on two time-related factors which correlate to radiobiological effects: the duration of radiation application, and the functional form of how the dose is applied over that time (the "temporal pattern of applied dose"). Although the former has been well studied, the latter has not. Thus, the goal of this research is to investigate the impact of the temporal pattern of applied dose on the survival of human cells and to explore how the manipulation of this temporal dose pattern may be incorporated into an IMRT-based radiation therapy treatment planning scheme. The hypothesis is that the temporal pattern of applied dose in a single fraction of radiation can be optimized to maximize or minimize cell kill. Furthermore, techniques which utilize this effect could have clinical ramifications. In situations where increased cell kill is desirable, such as tumor control, or limiting the degree of cell kill is important, such as the sparing of normal tissue, temporal sequences of dose which maximize or minimize cell kill (temporally "optimized" sequences) may provide greater benefit than current clinically used radiation patterns. In the first part of this work, an LQ-based modeling analysis of effects of the temporal pattern of dose on cell kill is performed. Through this, patterns are identified for maximizing cell kill for a

  19. MacDUST - a powder diffraction package developed for the ''ADONE'' high resolution diffraction station

    International Nuclear Information System (INIS)

    Burattini, E.; Cappuccio, G.; Maistrelli, P.; Simeoni, S.

    1993-01-01

    A High Resolution Powder Diffraction Station (PO.DI.STA.) was installed at the beginning of 1991 on the ADONE-Wiggler magnet beam line. The station and the first powder diffraction spectra, collected with synchrotron radiation, were presented at the EPDIC-1 Conference. More details can also be found in. For this station, a very sophisticated software package ''MacDUST'' has been developed on an Apple Macintosh computer, using the Microsoft QuickBASIC compiler. It allows very easy and comfortable operations by means of a graphical user interface environment, typical of the Macintosh system. The package consists of five major programs. The main program, MacDIFF, performs all the graphic operations on the experimental data, including zooming, overlapping, cursor scanning and editing of patterns, control of output operations to printers and HPGL plotters. It also includes several analysis routines for data smoothing, a first derivative peak search algorithm, two background subtraction routines and two profile fitting programs: one based on the simplex method and the other on the Marquardt modification of a least-square algorithm. MacPDF and MacRIC are both dedicated to phase identification. The first program is an archive manager for searching, displaying and printing phase records; MacRIC is a graphic aided search-match program based on the Hanawalt algorithm. Mac3-DIM is a plot program, useful, e.g., for representing kinetics three dimensionally. MacRIET is a Macintosh version of the well known Rietveld refinement program. This version, besides conventional structure refinements, also allows the determination of micro structural parameters, i.e. micro strain and crystallite size. The program can also be used to simulate a pattern, once the structure of the compound is known. Taking advantage of the very intuitive Macintosh graphic user interface, through dialog and alert boxes, the program allows straightforward introduction and modification of the structure

  20. Study on mineral components of rat calvaria by means of X-ray powder diffraction analysis and Raman microprobe spectroscopy

    Energy Technology Data Exchange (ETDEWEB)

    Tamura, Norihiro [Meikai Univ., Sakado, Saitama (Japan). School of Dentistry

    2000-07-01

    The present study was designed to examine the occurrence of the precursor minerals of hydroxyapatite (HA) during the process of HA formation in the rat calvaria. Dried and powdered rat calvaria and synthetic samples, such as HA, dicalcium phosphate dihydrate (DCPD), octacalcium phosphate (OCP), ({beta}-calcium pyrophosphate) and ({beta}-tricalcium phosphate), were used. Determinations were carried out by X-ray powder diffraction and Raman microprobe spectrometry. In general, significant widening of the diffraction peaks was shown to occur after the plasma ashing was performed for the X-ray diffraction. As a result, two adjacent peaks seen normally in the diffraction angles (2 {theta}) 30-35 deg, which is a characteristic feature of HA, were found to fuse with each other, forming a widened single peak. Also, there was a tendency for the intensity of the diffraction peaks to increase with age. With regard to the effect of plasma ashing on the crystallograms of synthetic specimens, all specimens manifested sharp peak patterns except DCPD and OCP. In contrast, a widening of diffraction peaks was observed in the DCPD and OCP samples, indicating that crystallinity had changed during the pretreatment. Results obtained from both vital and synthetic samples after heat treatment at 1000 deg C were as follow: Clearcut diffraction patterns, characteristics of HA, were obtained in all of the calvaria samples. Further, {beta}-TCP was produced by heat treatment of OCP, and its pattern was detected in the samples from rats younger than 6 days of age. Amounts of {beta}-TCP in percentage were disclosed to be 40.2% in embryonal samples, 28.4% in newborn samples, and 18.6% in 6-day-old samples. But no {beta}-TCP could be detected in the 12-week-old samples, indicating that the amount of {beta}-TCP in calvaria decreased with age. We also found that ashing pretreatment did not cause any changes in the samples of HA, {beta}-CPP, and {beta}-TCP. Further, DCPD and {beta}-CPP samples shared

  1. Study on mineral components of rat calvaria by means of X-ray powder diffraction analysis and Raman microprobe spectroscopy

    International Nuclear Information System (INIS)

    Tamura, Norihiro

    2000-01-01

    The present study was designed to examine the occurrence of the precursor minerals of hydroxyapatite (HA) during the process of HA formation in the rat calvaria. Dried and powdered rat calvaria and synthetic samples, such as HA, dicalcium phosphate dihydrate (DCPD), octacalcium phosphate (OCP), (β-calcium pyrophosphate) and (β-tricalcium phosphate), were used. Determinations were carried out by X-ray powder diffraction and Raman microprobe spectrometry. In general, significant widening of the diffraction peaks was shown to occur after the plasma ashing was performed for the X-ray diffraction. As a result, two adjacent peaks seen normally in the diffraction angles (2 θ) 30-35 deg, which is a characteristic feature of HA, were found to fuse with each other, forming a widened single peak. Also, there was a tendency for the intensity of the diffraction peaks to increase with age. With regard to the effect of plasma ashing on the crystallograms of synthetic specimens, all specimens manifested sharp peak patterns except DCPD and OCP. In contrast, a widening of diffraction peaks was observed in the DCPD and OCP samples, indicating that crystallinity had changed during the pretreatment. Results obtained from both vital and synthetic samples after heat treatment at 1000 deg C were as follow: Clearcut diffraction patterns, characteristics of HA, were obtained in all of the calvaria samples. Further, β-TCP was produced by heat treatment of OCP, and its pattern was detected in the samples from rats younger than 6 days of age. Amounts of β-TCP in percentage were disclosed to be 40.2% in embryonal samples, 28.4% in newborn samples, and 18.6% in 6-day-old samples. But no β-TCP could be detected in the 12-week-old samples, indicating that the amount of β-TCP in calvaria decreased with age. We also found that ashing pretreatment did not cause any changes in the samples of HA, β-CPP, and β-TCP. Further, DCPD and β-CPP samples shared the same diffraction pattern, and OCP

  2. The First X-ray Diffraction Patterns of Clay Minerals from Gale Crater

    Science.gov (United States)

    Bristow, Thomas; Blake, David; Bish, David L.; Vaniman, David; Ming, Douglas W.; Morris, Richard V.; Chipera, Steve; Rampe, Elizabeth B.; Farmer, Jack, D.; Treiman, Allan H; hide

    2013-01-01

    The Mars Science Laboratory (MSL) Rover, Curiosity spent approx 150 sols at Yellowknife Bay (YKB) studying a section of fluvio-lacustrine sedimentary rocks (with potential indications of volcanic influence), informally known as the Yellowknife Bay formation. YKB lies in a distal region of the Peace Vallis alluvial fan, which extends from the northern rim of Gale Crater toward the dune field at the base of Mt Sharp. Sedimentological and stratigraphic observations are consistent with the Yellowknife Bay formation being part of a distal fan deposit, which could be as young as middle Hesperian to even early Amazonian in age (approx 3.5 to 2.5 Ga). The Yellowknife Bay formation hosts a unit of mudstone called the Sheepbed member. Curiosity obtained powdered rock samples from two drill holes in the Sheepbed Member, named John Klein and Cumberland, and delivered them to instruments in Curiosity. Data from CheMin, a combined X-ray diffraction (XRD)/X-ray fluorescence instrument (XRF), has allowed detailed mineralogical analysis of mudstone powders revealing a clay mineral component of approx 20 wt.% in each sample. The clay minerals are important indicators of paleoenvironmental conditions and sensitive recorders of post-depositional alteration processes. The XRD pattern of John Klein reveals a 021 band consistent with a trioctahedral phyllosilicate. A broad peak at approx 10A with a slight inflexion at approx 12A indicates the presence of 2:1 type clay minerals in the John Klein sample. The trioctahedral nature of the clay minerals, breadth of the basal reflection, and presence of a minor component with larger basal spacing suggests that John Klein contains a trioctahedral smectite (probably saponite), whose interlayer is largely collapsed because of the low-humidity conditions. The XRD patterns show no evidence of corrensite (mixed-layer chlorite/smectite) or chlorite, which are typical diagenetic products of trioctahedral smectites when subjected to burial and heating

  3. X-ray diffraction measurement of residual stress in sol-gel grown lead zirconate titanate thick films on nickel-based super alloy substrate

    Energy Technology Data Exchange (ETDEWEB)

    Hoshyarmanesh, Hamidreza; Nehzat, Naser; Salehi, Mehdi [Isfahan University of Technology, Isfahan (Iran, Islamic Republic of); Ghodsi, Mojtaba [Sultan Qaboos University, Muscat (Oman)

    2015-02-15

    Residual compressive stress of Pb(Zr{sub 0.52}Ti{sub 0.48})O{sub 3} thick films was investigated using residual strains derived from X-ray diffraction patterns. Sin{sup 2}ψ method was applied for the 5, 10 and 15 μm sol-gel derived thick films annealed at 700 .deg. C for 1 hr as high frequency structural health monitoring square-shape transducers of 10 x10 mm, deposited onto the curved nickel-based super alloy substrates. A triaxial model was proposed based on piezoelectric constitutive equations, and Bragg's law at a large diffraction angle (∼89°) was utilized considering the electromechanical coupling factor as well as elastic, dielectric and piezoelectric constants. Thickness variations led to a significant change in residual stress magnitudes delineated from more-accurate triaxial model compared to small angle plane-stress results not considering the piezoelectric coupling effects.

  4. X-ray diffraction from single GaAs nanowires

    Energy Technology Data Exchange (ETDEWEB)

    Biermanns, Andreas

    2012-11-12

    In recent years, developments in X-ray focussing optics have allowed to produce highly intense, coherent X-ray beams with spot sizes in the range of 100 nm and below. Together with the development of new experimental stations, X-ray diffraction techniques can now be applied to study single nanometer-sized objects. In the present work, X-ray diffraction is applied to study different aspects of the epitaxial growth of GaAs nanowires. Besides conventional diffraction methods, which employ X-ray beams with dimensions of several tens of {mu}m, special emphasis lies on the use of nanodiffraction methods which allow to study single nanowires in their as-grown state without further preparation. In particular, coherent X-ray diffraction is applied to measure simultaneously the 3-dimensional shape and lattice parameters of GaAs nanowires grown by metal-organic vapor phase epitaxy. It is observed that due to a high density of zinc-blende rotational twins within the nanowires, their lattice parameter deviates systematically from the bulk zinc-blende phase. In a second step, the initial stage in the growth of GaAs nanowires on Si (1 1 1) surfaces is studied. This nanowires, obtained by Ga-assisted growth in molecular beam epitaxy, grow predominantly in the cubic zinc-blende structure, but contain inclusions of the hexagonal wurtzite phase close to their bottom interface. Using nanodiffraction methods, the position of the different structural units along the growth axis is determined. Because the GaAs lattice is 4% larger than silicon, these nanowires release their lattice mismatch by the inclusion of dislocations at the interface. Whereas NWs with diameters below 50 nm are free of strain, a rough interface structure in nanowires with diameters above 100 nm prevents a complete plastic relaxation, leading to a residual strain at the interface that decays elastically along the growth direction. Finally, measurements on GaAs-core/InAs-shell nanowire heterostructures are presented

  5. Fast parallel diffractive multi-beam femtosecond laser surface micro-structuring

    Energy Technology Data Exchange (ETDEWEB)

    Zheng Kuang, E-mail: z.kuang@liv.ac.uk [Laser Group, Department of Engineering, University of Liverpool, Brodie Building, Liverpool L69 3GQ (United Kingdom); Dun Liu; Perrie, Walter; Edwardson, Stuart; Sharp, Martin; Fearon, Eamonn; Dearden, Geoff; Watkins, Ken [Laser Group, Department of Engineering, University of Liverpool, Brodie Building, Liverpool L69 3GQ (United Kingdom)

    2009-04-15

    Fast parallel femtosecond laser surface micro-structuring is demonstrated using a spatial light modulator (SLM). The Gratings and Lenses algorithm, which is simple and computationally fast, is used to calculate computer generated holograms (CGHs) producing diffractive multiple beams for the parallel processing. The results show that the finite laser bandwidth can significantly alter the intensity distribution of diffracted beams at higher angles resulting in elongated hole shapes. In addition, by synchronisation of applied CGHs and the scanning system, true 3D micro-structures are created on Ti6Al4V.

  6. Determination of densities from chemical composition and X-Ray diffraction

    International Nuclear Information System (INIS)

    Azevedo, A.L.T. de

    1980-01-01

    X-ray diffraction method applied to retained austenite measurements gives volume per cent results, whereas the same kind of measurement made by Moessbauer Effect gives iron percentages. To compare both results one needs to convert the volume % to weight % or vice-versa. This necessitates, among other things, in determining the densities of the α and #betta# phases in the steel being studied. A method for calculating the densities, based on the application of the definition of density to just one unit cell, using X-ray diffraction and chemical results, are described. (Author) [pt

  7. Quantitative determination of mineral composition by powder X-ray diffraction

    International Nuclear Information System (INIS)

    Pawloski, G.A.

    1986-01-01

    A method is described of quantitatively determining the mineral composition in a test sample containing a number (m) of minerals from a group (n) of known minerals, wherein n=13, where mless than or equal ton, by x-ray diffraction, comprising: determining from standard samples of the known minerals a set of (n) standard coefficients K/sub j/=(X/sub j//X/sub l/)(I/sub l//I/sub j/) for each mineral (j=2...n) in the group of known minerals (j=2...n) relative to one mineral (l) in the group selected as a reference mineral, where X is the weight fraction of the mineral in a standard sample, and I is the x-ray integrated intensity peak of each mineral obtained from the standard sample; obtaining an x-ray diffraction pattern of the test sample; identifying each of the (m) minerals in the test sample for the x-ray diffraction pattern; calculating the relative weight fractions X/sub j//X/sub l/ for each mineral (j=2...m) compared to the reference mineral (l) from the ratio of the measured highest integrated intensity peak I/sub j/ of each mineral in the test sample to the measured highest integrated intensity peak I/sub l/ of the reference mineral in the test sample, and from the previously determined standard coefficients, X/sub j//X/sub l/=K/sub j/(I/sub j//I/sub l/

  8. The Scherrer equation and the dynamical theory of X-ray diffraction.

    Science.gov (United States)

    Muniz, Francisco Tiago Leitão; Miranda, Marcus Aurélio Ribeiro; Morilla Dos Santos, Cássio; Sasaki, José Marcos

    2016-05-01

    The Scherrer equation is a widely used tool to determine the crystallite size of polycrystalline samples. However, it is not clear if one can apply it to large crystallite sizes because its derivation is based on the kinematical theory of X-ray diffraction. For large and perfect crystals, it is more appropriate to use the dynamical theory of X-ray diffraction. Because of the appearance of polycrystalline materials with a high degree of crystalline perfection and large sizes, it is the authors' belief that it is important to establish the crystallite size limit for which the Scherrer equation can be applied. In this work, the diffraction peak profiles are calculated using the dynamical theory of X-ray diffraction for several Bragg reflections and crystallite sizes for Si, LaB6 and CeO2. The full width at half-maximum is then extracted and the crystallite size is computed using the Scherrer equation. It is shown that for crystals with linear absorption coefficients below 2117.3 cm(-1) the Scherrer equation is valid for crystallites with sizes up to 600 nm. It is also shown that as the size increases only the peaks at higher 2θ angles give good results, and if one uses peaks with 2θ > 60° the limit for use of the Scherrer equation would go up to 1 µm.

  9. Entropy criteria applied to pattern selection in systems with free boundaries

    Science.gov (United States)

    Kirkaldy, J. S.

    1985-10-01

    The steady state differential or integral equations which describe patterned dissipative structures, typically to be identified with first order phase transformation morphologies like isothermal pearlites, are invariably degenerate in one or more order parameters (the lamellar spacing in the pearlite case). It is often observed that a different pattern is attained at the steady state for each initial condition (the hysteresis or metastable case). Alternatively, boundary perturbations and internal fluctuations during transition up to, or at the steady state, destroy the path coherence. In this case a statistical ensemble of imperfect patterns often emerges which represents a fluctuating but recognizably patterned and unique average steady state. It is cases like cellular, lamellar pearlite, involving an assembly of individual cell patterns which are regularly perturbed by local fluctuation and growth processes, which concern us here. Such weakly fluctuating nonlinear steady state ensembles can be arranged in a thought experiment so as to evolve as subsystems linking two very large mass-energy reservoirs in isolation. Operating on this discontinuous thermodynamic ideal, Onsager’s principle of maximum path probability for isolated systems, which we interpret as a minimal time correlation function connecting subsystem and baths, identifies the stable steady state at a parametric minimum or maximum (or both) in the dissipation rate. This nonlinear principle is independent of the Principle of Minimum Dissipation which is applicable in the linear regime of irreversible thermodynamics. The statistical argument is equivalent to the weak requirement that the isolated system entropy as a function of time be differentiable to the second order despite the macroscopic pattern fluctuations which occur in the subsystem. This differentiability condition is taken for granted in classical stability theory based on the 2nd Law. The optimal principle as applied to isothermal and

  10. High-energy diffraction microscopy at the advanced photon source

    DEFF Research Database (Denmark)

    Lienert, U.; Li, S. F.; Hefferan, C. M.

    2011-01-01

    The status of the High Energy Diffraction Microscopy (HEDM) program at the 1-ID beam line of the Advanced Photon Source is reported. HEDM applies high energy synchrotron radiation for the grain and sub-grain scale structural and mechanical characterization of polycrystalline bulk materials in situ...

  11. Observation of parametric X-ray radiation in an anomalous diffraction region

    Energy Technology Data Exchange (ETDEWEB)

    Alexeyev, V.I., E-mail: vial@x4u.lebedev.ru [P.N. Lebedev Physical Institute RAS, 53 Leninskiy prospect, Moscow (Russian Federation); Belgorod National Research University, 85 Pobedy st., Belgorod (Russian Federation); Eliseyev, A.N., E-mail: elisseev@pluton.lpi.troitsk.ru [P.N. Lebedev Physical Institute RAS, 53 Leninskiy prospect, Moscow (Russian Federation); Belgorod National Research University, 85 Pobedy st., Belgorod (Russian Federation); Irribarra, E., E-mail: esteban.irribarra@epn.edu.ec [Escuela Politécnica Nacional, Ladrón de Guevara E11-253, Quito (Ecuador); Kishin, I.A., E-mail: ivan.kishin@mail.ru [P.N. Lebedev Physical Institute RAS, 53 Leninskiy prospect, Moscow (Russian Federation); Belgorod National Research University, 85 Pobedy st., Belgorod (Russian Federation); Kubankin, A.S., E-mail: kubankin@bsu.edu.ru [P.N. Lebedev Physical Institute RAS, 53 Leninskiy prospect, Moscow (Russian Federation); Belgorod National Research University, 85 Pobedy st., Belgorod (Russian Federation); Nazhmudinov, R.M., E-mail: fizeg@bk.ru [P.N. Lebedev Physical Institute RAS, 53 Leninskiy prospect, Moscow (Russian Federation); Belgorod National Research University, 85 Pobedy st., Belgorod (Russian Federation)

    2016-08-19

    A new possibility to expand the energy region of diffraction processes based on the interaction of relativistic charged particles with crystalline structures is presented. Diffracted photons related to parametric X-ray radiation produced by relativistic electrons are detected below the low energy threshold for the X-ray diffraction mechanism in crystalline structures for the first time. The measurements were performed during the interaction of 7 MeV electrons with a textured polycrystalline tungsten foil and a highly oriented pyrolytic graphite crystal. The experiment results are in good agreement with a developed model based on the PXR kinematical theory. The developed experimental approach can be applied to separate the contributions of real and virtual photons to the total diffracted radiation generated during the interaction of relativistic charged particles with crystalline targets. - Highlights: • Parametric X-ray radiation below the low energy threshold for diffraction of free X-rays. • Experimental separation of the contributions from different radiation mechanisms. • PXR from relativistic electrons in mosaic crystals and textured polycrystlas.

  12. Influence of preferred orientation of minerals in the mineralogical identification process by X-ray diffraction

    Energy Technology Data Exchange (ETDEWEB)

    Silva, Amanda Luzia da; Oliveira, Arno H. de [Universidade Federal de Minas Gerais (DEN/UFMG), Belo Horizonte, MG (Brazil). Dept. de Engenharia Nuclear; Fernandes, Maria Lourdes Souza, E-mail: lourdesfernandes@ufmg.b [Universidade Federal de Minas Gerais (UFMG), Belo Horizonte, MG (Brazil). Inst. de GeoCiencias. Centro de Pesquisa Professor Manoel Teixeira da Costa

    2011-07-01

    The X-ray diffraction corresponds to one of the main techniques for characterization of microstructures in crystalline materials, widely used in the identification of minerals in samples of geological materials. Some minerals have a property called preferred orientation which corresponds to the orientation tendency of the crystals of ground minerals to orient themselves in certain directions according to a preferred crystallographic plane. This property affects the analysis by X-ray diffraction and this fact can generates erroneous results in the characterization. The purpose of this study is to identify the negative influence of the preferred orientation of a mineral in the generation of diffraction patterns obtained in the X-ray diffraction analysis. For this, a sample of muscovite, a mineral of mica group, was prepared by two different methods: the frontal method and the back loading method. In the analysis using the frontal method there was displacement of the XRD pattern in the abscissa axis, where it was observed changes in interplanar distance and angle 2{theta} values, which are essential information for characterization and identification of a mineral. In the analysis using the back loading method, the generated XRD pattern showed no displacement in the axis of abscissas and showed interplanar distance and angle 2{theta} values closer to the real values for the muscovite. The results showed that one can only make improvements to the process of sample preparation minimizing the effect of preferred orientation in the analysis. There is no need to change conditions of diffractometer measurements. (author)

  13. Influence of preferred orientation of minerals in the mineralogical identification process by X-ray diffraction

    International Nuclear Information System (INIS)

    Silva, Amanda Luzia da; Oliveira, Arno H. de; Fernandes, Maria Lourdes Souza

    2011-01-01

    The X-ray diffraction corresponds to one of the main techniques for characterization of microstructures in crystalline materials, widely used in the identification of minerals in samples of geological materials. Some minerals have a property called preferred orientation which corresponds to the orientation tendency of the crystals of ground minerals to orient themselves in certain directions according to a preferred crystallographic plane. This property affects the analysis by X-ray diffraction and this fact can generates erroneous results in the characterization. The purpose of this study is to identify the negative influence of the preferred orientation of a mineral in the generation of diffraction patterns obtained in the X-ray diffraction analysis. For this, a sample of muscovite, a mineral of mica group, was prepared by two different methods: the frontal method and the back loading method. In the analysis using the frontal method there was displacement of the XRD pattern in the abscissa axis, where it was observed changes in interplanar distance and angle 2θ values, which are essential information for characterization and identification of a mineral. In the analysis using the back loading method, the generated XRD pattern showed no displacement in the axis of abscissas and showed interplanar distance and angle 2θ values closer to the real values for the muscovite. The results showed that one can only make improvements to the process of sample preparation minimizing the effect of preferred orientation in the analysis. There is no need to change conditions of diffractometer measurements. (author)

  14. Application of ray tracing towards a correction for refracting effects in computed tomography with diffracting sources

    International Nuclear Information System (INIS)

    Andersen, A.H.

    1983-01-01

    Ray tracing methods are investigated in forward and inverse processes and applied for image restoration and resolution enhancement in computed tomography with diffracting sources. Within the geometrical optics approximation for a given refractive field, a mathematical model for the forward propagation and inverse reconstruction process is presented. For a finite set of rays in a discrete image representation, an algebraic reconstruction technique is derived which is analogous to the inverse process for a continuum of rays. The geometrical theory of diffraction is invoked to describe ray patterns arising from the introduction of object discontinuity surfaces. We have compared the performance of existing recursive ray tracing techniques for the reconstruction of objects exhibiting discontinuity boundaries. A novel ray tracing and reconstruction technique is presented which enjoys significant computational savings over traditional implementations incorporating tedious ray linking procedures. Simulation studies illustrate the macro-structural distortion and loss of fine resolution when ray refraction is unaccounted for. Restoration and resolution enhancement is achieved with a recursive ray tracing approach. Successful experimental studies with tissue equivalent phantoms are presented. The comparison of simulation and experimental results demonstrated the reasonable assumption of the geometrical optics approximation. Simulation results for larger refractive deviations are encouraging

  15. The diffractive achromat full spectrum computational imaging with diffractive optics

    KAUST Repository

    Peng, Yifan

    2016-07-11

    Diffractive optical elements (DOEs) have recently drawn great attention in computational imaging because they can drastically reduce the size and weight of imaging devices compared to their refractive counterparts. However, the inherent strong dispersion is a tremendous obstacle that limits the use of DOEs in full spectrum imaging, causing unacceptable loss of color fidelity in the images. In particular, metamerism introduces a data dependency in the image blur, which has been neglected in computational imaging methods so far. We introduce both a diffractive achromat based on computational optimization, as well as a corresponding algorithm for correction of residual aberrations. Using this approach, we demonstrate high fidelity color diffractive-only imaging over the full visible spectrum. In the optical design, the height profile of a diffractive lens is optimized to balance the focusing contributions of different wavelengths for a specific focal length. The spectral point spread functions (PSFs) become nearly identical to each other, creating approximately spectrally invariant blur kernels. This property guarantees good color preservation in the captured image and facilitates the correction of residual aberrations in our fast two-step deconvolution without additional color priors. We demonstrate our design of diffractive achromat on a 0.5mm ultrathin substrate by photolithography techniques. Experimental results show that our achromatic diffractive lens produces high color fidelity and better image quality in the full visible spectrum. © 2016 ACM.

  16. Restoration of diffracted far field at the output of circular diffraction waveplate

    International Nuclear Information System (INIS)

    Hovhannisyan, D; Margaryan, H; Abrahamyan, V; Hakobyan, N; Tabiryan, N

    2014-01-01

    The light propagation in an anisotropic periodic media, such us circular diffraction waveplate (CDW) by a finite-difference time-domain (FDTD) technique is studied. The FDTD numerical simulation and the subsequent Fourier transform of the diffracted electric near field was been used for study of ability of CDW to diffract a laser beam and simultaneously convert polarization state. The FDTD simulation results used to restore the diffracted electric far field at the CDW output. an abstract

  17. Multiple Order Diffractions by laser-Injured Transient Grating in Nematic MBBA Film

    International Nuclear Information System (INIS)

    Kim, Seong Kyu; Kim, Hack Jin

    1999-01-01

    The laser-induced transient grating method is applied to study the dynamics of the nematic MBBA film. The nanosecond laser pulses of 355 nm are used to make the transient grating and the cw He-Ne laser of 633 nm is used to probe the dynamics. Strong multiple order diffractions are observed at high nematic temperatures. The reordering process induced by the phototransformed state, which is the locally melted state from the nematic sample, is attributed to the main origin of the multiple order diffractions from the nematic MBBA. The characteristics of the multiple order gratings are discussed with the grating profiles simulated from the multiple diffraction signals

  18. Boundary diffraction wave integrals for diffraction modeling of external occulters

    OpenAIRE

    Cady, E.

    2012-01-01

    An occulter is a large diffracting screen which may be flown in conjunction with a telescope to image extrasolar planets. The edge is shaped to minimize the diffracted light in a region beyond the occulter, and a telescope may be placed in this dark shadow to view an extrasolar system with the starlight removed. Errors in position, orientation, and shape of the occulter will diffract additional light into this region, and a challenge of modeling an occulter system is to accurately and quickly...

  19. Grain orientation mapping of passivated aluminum interconnect wires with X-ray micro-diffraction

    International Nuclear Information System (INIS)

    MacDowell, A.A.; Padmore, H.A.; Thompson, A.C.; Chang, C.H.; Patel, J.R.

    1998-06-01

    A micro x-ray diffraction facility is under development at the Advanced Light source. Spot sizes are typically about 1-microm size generated by means of grazing incidence Kirkpatrick-Baez focusing mirrors. Photon energy is either white of energy range 6--14 keV or monochromatic generated from a pair of channel cut crystals. A Laue diffraction pattern from a single grain in passivated 2-microm wide bamboo structured Aluminum interconnect line has been recorded. Acquisition times are of the order of a few seconds. The Laue pattern has allowed the determination of the crystallographic orientation of individual grains along the line length. The experimental and analysis procedures used are described, as is a grain orientation result. The future direction of this program is discussed in the context of strain measurements in the area of electromigration

  20. Expression, purification and preliminary diffraction studies of PhnP

    International Nuclear Information System (INIS)

    Podzelinska, Kateryna; He, Shumei; Soares, Alexei; Zechel, David; Hove-Jensen, Bjarne; Jia, Zongchao

    2008-01-01

    PhnP, a member of the C—P lyase pathway, was crystallized by the sitting-drop vapour-diffusion method and the initial diffraction-pattern analysis is reported. PhnP belongs to a 14-gene operon that supports the growth of Escherichia coli on alkylphosphonates as a sole source of phosphorus; however, the exact biochemistry of phosphonate degradation by this pathway is poorly understood. The protein was recombinantly expressed in Escherichia coli and purified to homogeneity. Sitting-drop vapour diffusion in combination with microseeding was used to obtain crystals that were suitable for X-ray diffraction. Data were collected to 1.3 Å and the crystals belonged to space group C2, with unit-cell parameters a = 111.65, b = 75.41, c = 83.23 Å, α = γ = 90, β = 126.3°

  1. Study of the diffraction in the microscope: Annular condenser

    International Nuclear Information System (INIS)

    Ciocci, L; Echarri, R M; Simon, J M

    2011-01-01

    In this work we study the diffraction in the microscope when an annular condenser is used to illuminate the object. We calculate the point spread function (PSF) for a pinhole in an opaque screen illuminated with an annular condenser, consisting in an 1D array of incoherent point sources. We compare it with the PSF for a self-luminous point object, finding that the central disk of the diffraction pattern is narrower and the first intensity minimum is deeper for illuminated objects. We also analyze the resolution of the system by means of the intensity profile produced by two points objects, finding that two self luminous point objects are better resolved than two illuminated objects at the same distance. This suggests that the correlation introduced in the object diminishes the resolution in the former case.

  2. Angular beam width of a slit-diffracted wave with noncollinear group and phase velocities

    International Nuclear Information System (INIS)

    Lock, Edwin H

    2012-01-01

    Taking magnetostatic surface wave diffraction as an example, this paper theoretically investigates the 2D diffraction pattern arising in the far-field region of a ferrite slab in the case of a plane wave with noncollinear group and phase velocities incident on a wide, arbitrarily oriented slit in an opaque screen. A universal analytical formula for the angular width of a diffracted beam is derived, which is valid for magnetostatic and other types of waves in anisotropic media and structures (including metamaterials) in 2D geometries. It is shown that the angular width of a diffracted beam in an anisotropic medium can not only take values greater or less than λ 0 /D (where λ 0 is the incident wavelength, and D is the slit width), but can also be zero under certain conditions. (methodological notes)

  3. Model experiment of in vivo synchrotron X-ray diffraction of human kidney stones

    Energy Technology Data Exchange (ETDEWEB)

    Ancharov, A.I. [Institute of Solid State Chemistry and Mechanochemistry SB RAS, Novosibirsk (Russian Federation)]. E-mail: ancharov@mail.ru; Potapov, S.S. [Institute of Mineralogy UB RAS, Miass (Russian Federation); Moiseenko, T.N. [The State Regional Clinical Hospital, Novosibirsk (Russian Federation); Feofilov, I.V. [The State Regional Clinical Hospital, Novosibirsk (Russian Federation); Nizovskii, A.I. [Boreskov Institute of Catalysis SB RAS, Novosibirsk (Russian Federation)

    2007-05-21

    The diffraction of synchrotron radiation (SR) was used to explore the phase composition of kidney stones placed into a specific object phantom, which imitated the human body. As an imitation of the patient breath, the kidney stone was moved vertically and rotated to an angle of 15{sup o} during the recording of the X-ray pattern. It was shown that rotation and displacement did not distort the X-ray pattern.

  4. Model experiment of in vivo synchrotron X-ray diffraction of human kidney stones

    International Nuclear Information System (INIS)

    Ancharov, A.I.; Potapov, S.S.; Moiseenko, T.N.; Feofilov, I.V.; Nizovskii, A.I.

    2007-01-01

    The diffraction of synchrotron radiation (SR) was used to explore the phase composition of kidney stones placed into a specific object phantom, which imitated the human body. As an imitation of the patient breath, the kidney stone was moved vertically and rotated to an angle of 15 o during the recording of the X-ray pattern. It was shown that rotation and displacement did not distort the X-ray pattern

  5. Encapsulation process for diffraction gratings.

    Science.gov (United States)

    Ratzsch, Stephan; Kley, Ernst-Bernhard; Tünnermann, Andreas; Szeghalmi, Adriana

    2015-07-13

    Encapsulation of grating structures facilitates an improvement of the optical functionality and/or adds mechanical stability to the fragile structure. Here, we introduce novel encapsulation process of nanoscale patterns based on atomic layer deposition and micro structuring. The overall size of the encapsulated structured surface area is only restricted by the size of the available microstructuring and coating devices; thus, overcoming inherent limitations of existing bonding processes concerning cleanliness, roughness, and curvature of the components. Finally, the process is demonstrated for a transmission grating. The encapsulated grating has 97.5% transmission efficiency in the -1st diffraction order for TM-polarized light, and is being limited by the experimental grating parameters as confirmed by rigorous coupled wave analysis.

  6. Two-dimensional Kikuchi patterns of Si as measured using an electrostatic analyser

    Energy Technology Data Exchange (ETDEWEB)

    Vos, Maarten, E-mail: maarten.vos@anu.edu.au [Electronic Materials Engineering Department, Research School of Physics and Engineering, The Australian National University, Canberra 2601 (Australia); Winkelmann, Aimo [Bruker Nano GmbH, Am Studio 2D, Berlin 12489 (Germany)

    2016-12-15

    We present Kikuchi patterns of Si single crystals measured with an electrostatic analyser, where the kinetic energy of the diffracted electron is known with sub-eV precision. Two-dimensional patterns are acquired by rotating the crystal under computer control. This makes detailed comparison of calculated and measured distributions possible with precise knowledge of the energy of the scattered electrons. The case of Si is used to validate the method, and these experiments provide a detailed comparison of measured and calculated Kikuchi patterns. In this way, we can gain more insight on Kikuchi pattern formation in non-energy resolved measurements of conventional electron backscatter diffraction (EBSD) and electron channeling patterns (ECP). It was possible to identify the influence of channeling of the incoming beam on the measured Kikuchi pattern. The effect of energy loss on the Kikuchi pattern was established, and it is demonstrated that, under certain conditions, the channeling features have a different dependence on the energy loss compared to the Kikuchi lines. - Highlights: • Two-dimensional Kikuchi patterns measured for Silicon with electrostatic analyser. • Good agreement obtained with dynamical theory of diffraction. • Channeling effects of the incoming beam are identified.

  7. Profile analysis of neutron powder diffraction data at ISIS

    International Nuclear Information System (INIS)

    David, W.I.F.; Ibberson, R.M.; Matthewman, J.C.

    1992-05-01

    The aim of this manual is to document the current suite of time-of-flight neutron powder diffraction profile refinement programs available to ISIS users. Aspects of data collation and normalisation specific to the individual diffraction instruments are dealt with elsewhere. It will be assumed the user has produced a suitable data file (.DAT file) containing the profile data consisting of point by point values of the corrected diffraction profile across the pattern. The analysis of neutron powder diffraction data at ISIS by profile refinement utilises a suite of ''in-house'' written and supported programs based on the Cambridge Crystallography Subroutine Library (CCSL). A quick scan through the CCSL manual will give the user a general feel for the procedure to adopt in the use of the library and hence of the profile codes. The instructions documented in this handbook are complementary to those in the more specialist CCSL manual, and consequently go into no great detail regarding technical details of any of the CCSL routines. The programs may be run from each individual user account, for example [USER01], once the appropriate login procedure has been set-up by the instrument scientists. The programs are mostly activated by one line commands and only a basic knowledge of a VAX editor should be required; details can be found in the ''VAX primer'' available from Computer Support. (Author)

  8. Full k-space visualization of photoelectron diffraction

    International Nuclear Information System (INIS)

    Denlinger, J.D.; Rotenberg, E.; Kevan, S.D.; Tonner, B.P.

    1997-01-01

    The development of photoelectron holography has promoted the need for larger photoelectron diffraction data sets in order to improve the quality of real-space reconstructed images (by suppressing transformational artifacts and distortions). The two main experimental and theoretical approaches to holography, the transform of angular distribution patterns for a coarse selection of energies or the transform of energy-scanned profiles for several directions, represent two limits to k-space sampling. The high brightness of third-generation soft x-ray synchrotron sources provides the opportunity to rapidly measure large high-density x-ray photoelectron diffraction (XPD) data sets with approximately uniform k-space sampling. In this abstract, the authors present such a photoelectron data set acquired for Cu 3p emission from Cu(001). Cu(001) is one of the most well-studied systems for understanding photoelectron diffraction structure and for testing photoelectron holography methods. Cu(001) was chosen for this study in part due to the relatively inert and unreconstructed clean surface, and it served to calibrate and fine-tune the operation of a new synchrotron beamline, electron spectrometer and sample goniometer. In addition to Cu, similar open-quotes volumeclose quotes XPD data sets have been acquired for bulk and surface core-level emission from W(110), from reconstructed Si(100) and Si(111) surfaces, and from the adsorbate system of c(2x2) Mn/Ni(100)

  9. Neutron diffraction from holographic gratings in PMMA

    International Nuclear Information System (INIS)

    Havermeyer, F.; Kraetzig, E.; Rupp, R.A.; Schubert, D.W.

    1999-01-01

    Complete text of publication follows. By definition photorefractive materials change the refractive index for light under the action of light. Using the spatially modulated light intensity pattern from the interference of two plane waves, volume phase gratings with accurately defined spacings can be produced. Depending on the material there are many physical origins for these gratings, but in most cases they are linked to a density modulation and, consequently, to a refractive index grating for neutrons. By diffraction of light or neutrons from such gratings even small refractive index changes down to Δn ∼ 10 -7 - 10 -9 can be measured. In our photopolymer system PMMA/MMA (poly(methyl methacrylate) with a content of 10-20% of the residual monomer methyl methacrylate) inhomogeneous illumination leads to local post-polymerisation processes of the residual monomer. The resulting light-optical refractive index grating is caused by the modulation of the monomer/polymer ratio as well as by the modulation of the total density. Only by the unique combination of methods for light and neutron diffraction, available at HOLONS (Holography and Neutron Scattering, instrument at the GKSS research centre), both contributions can be separated. We discuss the angular dependence of the neutron diffraction efficiency for weakly and strongly (efficiencies up to 60% have been achieved) modulated gratings and propose a simple model for the evaluation of the gratings. (author)

  10. Geometrical characterization of micro-optical cylindrical lens arrays using angular resolved diffraction

    DEFF Research Database (Denmark)

    Iversen, Theis Faber Quist; Hanson, Steen Grüner

    2010-01-01

    been shown (Iversen et al 2009 J. Opt. A: Pure Appl. Opt. 11 054014 (6pp), B¨uttner and Zeitner 2002 Appl. Opt. 41 6841 8) that the average radius of curvature of an MLA structure can be extracted by observing the far-field diffraction pattern intensity distribution obtained from illumination....... By scanning the angle of incidence of the coherent illumination and simultaneously observing the diffracted intensity, information about the grating period and the radius of curvature can be extracted. The method is implemented with emphasis on further development for compact, high-speed dedicated systems. We...

  11. Phase behavior in diffraction

    International Nuclear Information System (INIS)

    Checon, A.

    1983-01-01

    Theoretical formulation of a straight edge diffraction shows a phase difference of π/2 between the incoming and diffracted waves. Experiments using two straight edges do not confirm the π/2 difference but suggest that the incoming wave is in phase with the wave diffracted into the shadowed region of the edge and out of phase by a factor of π with the wave diffracted into the illuminated region. (Author) [pt

  12. Refinement of the ferri and paramagnetic phases of magnetite measured by neutron multiple diffraction

    International Nuclear Information System (INIS)

    Mazzochi, V.L.; Parente, C.B.R.

    1989-10-01

    Structural parameters of the ferri and paramagnetic phases of magnetite have been refined from neutron multiple diffraction data. Experimental patterns were obtained by measuring the III primary reflection of a natural single crystal of this compound, at room temperature for the ferrimagnetic phase and 703 0 C for the paramagnetic phase. Theoretical multiple diffraction patterns for both phases have been calculated by the program MULTI which uses the iterative method. In this method intensities are caluclated as Taylor series expansions summed up to a order sufficient for a good approximation. A step by step process has been used in the refinements similarly to the parameter-shift method. Final values for the discrepancy factor found for the ferri and paramagnetic phases were R = 3.96% and R = 3.46%, respectively. (author) [pt

  13. Diffraction at TOTEM

    OpenAIRE

    Antchev, G.; Aspell, P.; Avati, V.; Bagliesi, M.G.; Berardi, V.; Berretti, M.; Bottigli, U.; Bozzo, M.; Brucken, E.; Buzzo, A.; Cafagna, F.; Calicchio, M.; Catanesi, M.G.; Catastini, P.L.; Cecchi, R.

    2008-01-01

    The TOTEM experiment at the LHC measures the total proton-proton cross section with the luminosity-independent method and the elastic proton-proton cross-section over a wide |t|-range. It also performs a comprehensive study of diffraction, spanning from cross-section measurements of individual diffractive processes to the analysis of their event topologies. Hard diffraction will be studied in collaboration with CMS taking advantage of the large common rapidity coverage for charged and neutral...

  14. Soft color interactions and diffractive hard scattering at the Tevatron

    International Nuclear Information System (INIS)

    Enberg, R.; Timneanu, N.; Ingelman, G.; Uppsala Univ.

    2001-06-01

    An improved understanding of nonperturbative QCD can be obtained by the recently developed soft color interaction models. Their essence is the variation of color string-field topologies, giving a unified description of final states in high energy interactions, e.g., diffractive and nondiffractive events in ep and pp. Here we present a detailed study of such models (the soft color interaction model and the generalized area law model) applied to pp, considering also the general problem of the underlying event including beam particle remnants. With models turned to HERA ep data, we find a good description also of Tevatron data on production of W, bottom and jets in diffractive events defined either by leading antiprotons or by one or two rapidity gaps in the forward or backward regions. We also give predictions for diffractive J/ψ production where the soft exchange mechanism produces both a gap and a color singlet cc state in the same event. This soft color interaction approach is also compared with Pomeron-based models for diffraction, and some possibilities to experimentally discriminate between these different approaches are discussed. (orig.)

  15. Qualitative analysis of powder x-ray diffraction data

    International Nuclear Information System (INIS)

    Raftery, T.

    1999-01-01

    Full text: The main task of qualitative analysis is the determination of the presence of major, minor and if practical trace phases in a sample. The attainment of this goal is dependent on the quality of alignment (line position and intensity) as well as quality of sample preparation. Identification is generally on the basis of structure and dependent on the use of reference patterns. There are inherent limitations to the use of reference patterns including lack of reference patterns for the phase of interest (rare), solid solutions or substitutions (likely) and poor quality of reference patterns (unusual). With multiphase samples, there are the added problems of line overlap or interference, determining minor or trace phases in the presence of major phases, the decrease of intensity with concentration and influence of mass absorption on intensities. Within multiphase samples there may be many phases, some of which are in low abundance. It is sometimes possible (and usually desirable) to fractionate the sample by some physical or chemical method (while attempting not to create new phases as a result). It is usually important and often critical to have available supplementary information about the sample - either chemical or physical, or a history of preparation or formation. A central issue is what constitutes a match. A match is an adequate accounting of the distribution of intensity in the diffraction pattern. The match can be thought of in terms of a sum of δ2θ (or δd/d) and/or δI/I ref , and the consistency with known information. The calculated measures give rise to the figures of merit (FOM) of search match programs. It must always be remembered that two compounds of the same space group and similar cell parameters (eg. FCC metals) are going to have very similar diffraction patterns - any search/match technique usually arrives at a stage where there is a list of possibilities that must be decided between. The range search-match techniques span manual

  16. Highlighting material structure with transmission electron diffraction correlation coefficient maps.

    Science.gov (United States)

    Kiss, Ákos K; Rauch, Edgar F; Lábár, János L

    2016-04-01

    Correlation coefficient maps are constructed by computing the differences between neighboring diffraction patterns collected in a transmission electron microscope in scanning mode. The maps are shown to highlight material structural features like grain boundaries, second phase particles or dislocations. The inclination of the inner crystal interfaces are directly deduced from the resulting contrast. Copyright © 2016 Elsevier B.V. All rights reserved.

  17. Profiling pleural effusion cells by a diffraction imaging method

    Science.gov (United States)

    Al-Qaysi, Safaa; Hong, Heng; Wen, Yuhua; Lu, Jun Q.; Feng, Yuanming; Hu, Xin-Hua

    2018-02-01

    Assay of cells in pleural effusion (PE) is an important means of disease diagnosis. Conventional cytology of effusion samples, however, has low sensitivity and depends heavily on the expertise of cytopathologists. We applied a polarization diffraction imaging flow cytometry method on effusion cells to investigate their features. Diffraction imaging of the PE cell samples has been performed on 6000 to 12000 cells for each effusion cell sample of three patients. After prescreening to remove images by cellular debris and aggregated non-cellular particles, the image textures were extracted with a gray level co-occurrence matrix (GLCM) algorithm. The distribution of the imaged cells in the GLCM parameters space was analyzed by a Gaussian Mixture Model (GMM) to determine the number of clusters among the effusion cells. These results yield insight on textural features of diffraction images and related cellular morphology in effusion samples and can be used toward the development of a label-free method for effusion cells assay.

  18. Diffraction of stochastic electromagnetic fields by a hole in a thin film with real optical properties

    Science.gov (United States)

    Dorofeyev, Illarion

    2008-08-01

    The classical Kirchhoff theory of diffraction is extended to the case of real optical properties of a screen and its finite thickness. A spectral power density of diffracted electromagnetic fields by a hole in a thin film with real optical properties was calculated. The problem was solved by use of the vector Green theorems and related Green function of the boundary value problem. A spectral and spatial selectivity of the considered system was demonstrated. Diffracted patterns were calculated for the coherent and incoherent incident fields in case of holes array in a screen of perfect conductivity.

  19. Diffraction of stochastic electromagnetic fields by a hole in a thin film with real optical properties

    International Nuclear Information System (INIS)

    Dorofeyev, Illarion

    2008-01-01

    The classical Kirchhoff theory of diffraction is extended to the case of real optical properties of a screen and its finite thickness. A spectral power density of diffracted electromagnetic fields by a hole in a thin film with real optical properties was calculated. The problem was solved by use of the vector Green theorems and related Green function of the boundary value problem. A spectral and spatial selectivity of the considered system was demonstrated. Diffracted patterns were calculated for the coherent and incoherent incident fields in case of holes array in a screen of perfect conductivity

  20. Critical voltage effects in electron channeling patterns

    International Nuclear Information System (INIS)

    Farrow, R.C.

    1984-01-01

    Electron channeling patterns were used to study critical voltage effects in the metals molybdenum and tungsten. The purpose was to characterize both theoretically and experimentally how a critical voltage will affect the channeling pattern line shapes. The study focused on the second order critical voltage that results from the degeneracy between the Bloch wave states of the (110) and (220) reflections. Theoretical (110) series electron channeling pattern line profiles were calculated using the dynamical theory of Hirsch and Humphreys (1970). A 10 beam dynamical electron diffraction calculation was performed (using complex Fourier lattice potentials) to generate Bloch wave coefficients, excitation amplitudes, and absorption coefficients needed for determining backscattering coefficients and subsequent backscattered electron intensities. The theoretical model is applicable to electron diffraction at all energies since no high energy approximation or perturbation method was used

  1. Diffraction at TOTEM

    OpenAIRE

    Giani, S; Niewiadomski, H; Antchev, G; Aspell, P; Avati, V; Bagliesi, M G; Berardi, V; Berretti, M; Besta, M; Bozzo, M; Brücken, E; Buzzo, A; Cafagna, F; Calicchio, M; Catanesi, M G

    2010-01-01

    The primary objective of the TOTEM experiment at the LHC is the measurement of the total proton-proton cross section with the luminosity-independent method and the study of elastic proton-proton cross-section over a wide |t|-range. In addition TOTEM also performs a comprehensive study of diffraction, spanning from cross-section measurements of individual diffractive processes to the analysis of their event topologies. Hard diffraction will be studied in collaboration with CMS taking advantage...

  2. Arrangement and Applying of Movement Patterns in the Cerebellum Based on Semi-supervised Learning.

    Science.gov (United States)

    Solouki, Saeed; Pooyan, Mohammad

    2016-06-01

    Biological control systems have long been studied as a possible inspiration for the construction of robotic controllers. The cerebellum is known to be involved in the production and learning of smooth, coordinated movements. Therefore, highly regular structure of the cerebellum has been in the core of attention in theoretical and computational modeling. However, most of these models reflect some special features of the cerebellum without regarding the whole motor command computational process. In this paper, we try to make a logical relation between the most significant models of the cerebellum and introduce a new learning strategy to arrange the movement patterns: cerebellar modular arrangement and applying of movement patterns based on semi-supervised learning (CMAPS). We assume here the cerebellum like a big archive of patterns that has an efficient organization to classify and recall them. The main idea is to achieve an optimal use of memory locations by more than just a supervised learning and classification algorithm. Surely, more experimental and physiological researches are needed to confirm our hypothesis.

  3. Energy-weighted dynamical scattering simulations of electron diffraction modalities in the scanning electron microscope.

    Science.gov (United States)

    Pascal, Elena; Singh, Saransh; Callahan, Patrick G; Hourahine, Ben; Trager-Cowan, Carol; Graef, Marc De

    2018-04-01

    Transmission Kikuchi diffraction (TKD) has been gaining momentum as a high resolution alternative to electron back-scattered diffraction (EBSD), adding to the existing electron diffraction modalities in the scanning electron microscope (SEM). The image simulation of any of these measurement techniques requires an energy dependent diffraction model for which, in turn, knowledge of electron energies and diffraction distances distributions is required. We identify the sample-detector geometry and the effect of inelastic events on the diffracting electron beam as the important factors to be considered when predicting these distributions. However, tractable models taking into account inelastic scattering explicitly are lacking. In this study, we expand the Monte Carlo (MC) energy-weighting dynamical simulations models used for EBSD [1] and ECP [2] to the TKD case. We show that the foil thickness in TKD can be used as a means of energy filtering and compare band sharpness in the different modalities. The current model is shown to correctly predict TKD patterns and, through the dictionary indexing approach, to produce higher quality indexed TKD maps than conventional Hough transform approach, especially close to grain boundaries. Copyright © 2018 The Authors. Published by Elsevier B.V. All rights reserved.

  4. Performance improvements of binary diffractive structures via optimization of the photolithography and dry etch processes

    Science.gov (United States)

    Welch, Kevin; Leonard, Jerry; Jones, Richard D.

    2010-08-01

    Increasingly stringent requirements on the performance of diffractive optical elements (DOEs) used in wafer scanner illumination systems are driving continuous improvements in their associated manufacturing processes. Specifically, these processes are designed to improve the output pattern uniformity of off-axis illumination systems to minimize degradation in the ultimate imaging performance of a lithographic tool. In this paper, we discuss performance improvements in both photolithographic patterning and RIE etching of fused silica diffractive optical structures. In summary, optimized photolithographic processes were developed to increase critical dimension uniformity and featuresize linearity across the substrate. The photoresist film thickness was also optimized for integration with an improved etch process. This etch process was itself optimized for pattern transfer fidelity, sidewall profile (wall angle, trench bottom flatness), and across-wafer etch depth uniformity. Improvements observed with these processes on idealized test structures (for ease of analysis) led to their implementation in product flows, with comparable increases in performance and yield on customer designs.

  5. Synchrotron diffraction characterization of nanostructured KY{sub 3}F{sub 10}:Tb

    Energy Technology Data Exchange (ETDEWEB)

    Ichikawa, Rodrigo U.; Teixeira, Maria I.; Ranieri, Izilda M.; Martinez, Luis G., E-mail: ichikawa@usp.br, E-mail: miteixeira@ipen.br, E-mail: iranieri@ipen.br, E-mail: lgallego@ipen.br [Instituto de Pesquisas Energeticas e Nucleares (IPEN/CNEN-SP), Sao Paulo, SP (Brazil); Linhares, Horacio M.S.M.D., E-mail: horacio_marconi@yahoo.com.br [Universidade Federal Fluminense (INFES/UFF), Santo Antonio de Padua, RJ (Brazil); Turrillas, Xavier, E-mail: turrillas@gmail.com [Institut de Ciència de Materials de Barcelona (ICMAB/CSIC), Dept. of Crystallography, Bellaterra (Spain)

    2015-07-01

    Nanostructured rare-earth fluorides materials are being intensively studied recently due to their potential applications in high-dose dosimetry. Particularly, nanostructured Tb-doped KY{sub 3}F{sub 10} has shown satisfactory results to be used in this area. In the present work, the structure and microstructure of KY{sub 3}F{sub 10}:Tb was investigated by means of X-ray synchrotron diffraction. One of the samples was analyzed as synthesized and another after a heat treatment. Rietveld refinement of synchrotron diffraction data was applied to obtain cell parameters, atomic positions and atomic displacement factors and the results were compared to values found in literature. X-ray line profile analysis methods were applied to determine mean crystallite sizes and their distribution. (author)

  6. Teaching pattern diversification for optics course: motivate interest, open minds and apply flexibly

    Science.gov (United States)

    Wang, Yunxin; Wang, Dayong; Rong, Lu; Zhao, Jie

    2015-10-01

    Optics is one of the most important basic courses for college students majoring in Applied Physics in university, which can supply the essential theoretical foundation for the subsequent courses such as Information Optics and Electrodynamics etc.. So Optics course plays a supporting effect in the knowledge frame of the college students. Optics course has its own feature, for one thing, many optical contents cannot be understood directly and easily, for another the optical phenomenon or experiments are interesting and can be displayed intuitively. Considering the above feature, the diversiform teaching patterns are developed to improve the teaching effect. To motivate their interest, students have the chance to visit optical laboratory for both teaching demonstration and science research, and voluntary demonstration of teaching apparatus in class are another approach. Furthermore, digital simulation and experimental design according to the classical knowledge are introduced to the optics course, so students can comprehend and verify the optical principle. Students are encouraged to propose new ideas, and these ideas can be achieved with the help of teachers and the funds support from our university. Besides, some talent students will be invited to join a research group composing by graduate students and teachers. In this group, the students have the chance to touch frontier topics in optics. The diversification of teaching patterns can supply a developing space with the rising gradient for students, which can inspire the interest, open their minds and make them apply flexibly by the participatory and inquiry.

  7. X-ray diffraction and Moessbauer studies on superparamagnetic nickel ferrite (NiFe{sub 2}O{sub 4}) obtained by the proteic sol–gel method

    Energy Technology Data Exchange (ETDEWEB)

    Nogueira, N.A.S. [Departamento de Engenharia Metalúrgica e de Materiais, Centro de Tecnologia, Campus do Pici, Universidade Federal do Ceará – UFC, 60455-760 Fortaleza, CE (Brazil); Utuni, V.H.S.; Silva, Y.C. [Departamento de Física, Universidade Federal do Ceará – UFC, Campus do Pici, 60440-970 Fortaleza, CE (Brazil); Kiyohara, P.K. [Instituto de Física, Universidade de São Paulo – USP, 05315-970 São Paulo, SP (Brazil); Vasconcelos, I.F. [Departamento de Engenharia Metalúrgica e de Materiais, Centro de Tecnologia, Campus do Pici, Universidade Federal do Ceará – UFC, 60455-760 Fortaleza, CE (Brazil); Miranda, M.A.R., E-mail: marcus.a.r.miranda@gmail.com [Departamento de Física, Universidade Federal do Ceará – UFC, Campus do Pici, 60440-970 Fortaleza, CE (Brazil); Sasaki, J.M. [Departamento de Física, Universidade Federal do Ceará – UFC, Campus do Pici, 60440-970 Fortaleza, CE (Brazil)

    2015-08-01

    Nickel ferrite (NiFe{sub 2}O{sub 4}) nanoparticles were synthesized by the proteic sol–gel method at synthesis temperature of 250 °C, 300 °C and 400 °C, with the objective of obtaining superparamagnetic nanoparticles. Thermogravimetric analysis (TGA) and temperature-programed oxidation (TPO) presented peaks around 290 °C indicating that nickel ferrite was forming at this temperature. X-ray powder diffraction (XRPD) confirmed that the polycrystalline sample was single phased NiFe{sub 2}O{sub 4} with space group Fd3m. Scherrer equation applied to the diffraction patterns and transmission electron microscopy (TEM) images showed that the size of the nanoparticles ranged from 9 nm to 13 nm. TEM images also revealed that the nanoparticles were agglomerated, which was supported by the low values of surface area provided by the Brunauer-Emmet-Teller (BET) method. Moessbauer spectroscopy presented spectra composed of a superposition of three components: a sextet, a doublet and a broad singlet pattern. The sample synthetized at 300 °C had the most pronounced doublet pattern characteristic of superparamagnetic nanoparticles. In conclusion, this method was partially successful in obtaining superparamagnetic nickel ferrite nanoparticles, in which the synthetized samples were a mixture of nanoparticles with blocking temperature above and below room temperature. Magnetization curves revealed a small hysteresis, supporting the Moessbauer results. The sample with the higher concentration of superparamagnetic nanoparticles being the one synthetized at 300 °C. - Highlights: • Superparamagnetic nickel ferrite nanoparticles were grown by the proteic sol–gel method. • The proteic sol–gel method provided superparamagnetic nickel ferrite nanoparticles with sizes in the range of 9–13 nm. • Nickel ferrite nanoparticles were prepared at temperatures as low as 250 °C. • The nickel ferrite nanoparticles were studied by x-ray diffraction and Moessbauer.

  8. The Gaussian beam mode analysis of classical phase aberrations in diffraction-limited optical systems

    International Nuclear Information System (INIS)

    Trappe, Neil; Murphy, J Anthony; Withington, Stafford

    2003-01-01

    Gaussian beam mode analysis (GBMA) offers a more intuitive physical insight into how light beams evolve as they propagate than the conventional Fresnel diffraction integral approach. In this paper we illustrate that GBMA is a computationally efficient, alternative technique for tracing the evolution of a diffracting coherent beam. In previous papers we demonstrated the straightforward application of GBMA to the computation of the classical diffraction patterns associated with a range of standard apertures. In this paper we show how the GBMA technique can be expanded to investigate the effects of aberrations in the presence of diffraction by introducing the appropriate phase error term into the propagating quasi-optical beam. We compare our technique to the standard diffraction integral calculation for coma, astigmatism and spherical aberration, taking - for comparison - examples from the classic text 'Principles of Optics' by Born and Wolf. We show the advantages of GBMA for allowing the defocusing of an aberrated image to be evaluated quickly, which is particularly important and useful for probing the consequences of astigmatism and spherical aberration

  9. The Gaussian beam mode analysis of classical phase aberrations in diffraction-limited optical systems

    Science.gov (United States)

    Trappe, Neil; Murphy, J. Anthony; Withington, Stafford

    2003-07-01

    Gaussian beam mode analysis (GBMA) offers a more intuitive physical insight into how light beams evolve as they propagate than the conventional Fresnel diffraction integral approach. In this paper we illustrate that GBMA is a computationally efficient, alternative technique for tracing the evolution of a diffracting coherent beam. In previous papers we demonstrated the straightforward application of GBMA to the computation of the classical diffraction patterns associated with a range of standard apertures. In this paper we show how the GBMA technique can be expanded to investigate the effects of aberrations in the presence of diffraction by introducing the appropriate phase error term into the propagating quasi-optical beam. We compare our technique to the standard diffraction integral calculation for coma, astigmatism and spherical aberration, taking—for comparison—examples from the classic text 'Principles of Optics' by Born and Wolf. We show the advantages of GBMA for allowing the defocusing of an aberrated image to be evaluated quickly, which is particularly important and useful for probing the consequences of astigmatism and spherical aberration.

  10. Coherent Diffractive Imaging at LCLS

    Science.gov (United States)

    Schulz, Joachim

    2010-03-01

    Soft x-ray FEL light sources produce ultrafast x-ray pulses with outstanding high peak brilliance. This might enable the structure determination of proteins that cannot be crystallized. The deposited energy would destroy the molecules completely, but owing to the short pulses the destruction will ideally only happen after the termination of the pulse. In order to address the many challenges that we face in attempting molecular diffraction, we have carried out experiments in coherent diffraction from protein nanocrystals at the Linac Coherent Light Source (LCLS) at SLAC. The periodicity of these objects gives us much higher scattering signals than uncrystallized proteins would. The crystals are filtered to sizes less than 2 micron, and delivered to the pulsed X-ray beam in a liquid jet. The effects of pulse duration and fluence on the high-resolution structure of the crystals have been studied. Diffraction patterns are recorded at a repetition rate of 30 Hz with pnCCD detectors. This allows us to take 108,000 images per hour. With 2-mega-pixel-detectors this gives a data-rate of more than 400 GB per hour. The automated sorting and evaluation of hundreds of thousands images is another challenge of this kind of experiments. Preliminary results will be presented on our first LCLS experiments. This work was carried out as part of a collaboration, for which Henry Chapman is the spokesperson. The collaboration consists of CFEL DESY, Arizona State University, SLAC, Uppsala University, LLNL, The University of Melbourne, LBNL, the Max Planck Institute for Medical Research, and the Max Planck Advanced Study Group (ASG) at the CFEL. The experiments were carried out using the CAMP apparatus, which was designed and built by the Max Planck ASG at CFEL. The LCLS is operated by Stanford University on behalf of the U.S. Department of Energy, Office of Basic Energy Sciences.

  11. Applying Learning Analytics to Explore the Effects of Motivation on Online Students' Reading Behavioral Patterns

    Science.gov (United States)

    Sun, Jerry Chih-Yuan; Lin, Che-Tsun; Chou, Chien

    2018-01-01

    This study aims to apply a sequential analysis to explore the effect of learning motivation on online reading behavioral patterns. The study's participants consisted of 160 graduate students who were classified into three group types: low reading duration with low motivation, low reading duration with high motivation, and high reading duration…

  12. Accurate Antenna Models in Ground Penetrating Radar Diffraction Tomography

    DEFF Research Database (Denmark)

    Meincke, Peter; Kim, Oleksiy S.

    2002-01-01

    are modeled by their plane-wave receiving and transmitting spectra. We find these spectra numerically for a resistively loaded dipole using the method of moments. Also, we illustrate, through a numerical example, the importance of taking into account the correct antenna pattern in GPR diffraction tomography.......Linear inversion schemes based on the concept of diffraction tomography have proven successful for ground penetrating radar (GPR) imaging. In many GPR surveys, the antennas of the GPR are located close to the air-soil interface and, therefore, it is important to incorporate the presence...... of this interface in the inversion scheme (see Hansen, T.B. and Meincke Johansen, P., IEEE Trans. Geoscience and Remote Sensing, vol.38, p.496-506, 2000). Hansen and Meincke Johansen modeled the antennas as ideal (Hertzian) electric dipoles. Since practical GPR antennas are not ideal, it is of interest...

  13. Application of new synchrotron powder diffraction techniques to anomalous scattering from glasses

    International Nuclear Information System (INIS)

    Beno, M.A.; Knapp, G.S.; Armand, P.; Price, D.L.; Saboungi, M.

    1995-01-01

    We have applied two synchrotron powder diffraction techniques to the measurement of high quality anomalous scattering diffraction data for amorphous materials. One of these methods, which uses a curved perfect crystal analyzer to simultaneously diffract multiple powder lines into a position sensitive detector has been shown to possess high resolution, low background, and very high counting rates. This data measurement technique provides excellent energy resolution while minimizing systematic errors resulting from detector nonlinearity. Anomalous scattering data for a Cesium Germanate glass collected using this technique will be presented. The second powder diffraction technique uses a flat analyzer crystal to deflect multiple diffraction lines out of the equatorial plane. Calculations show that this method possesses sufficient energy resolution for anomalous scattering experiments when a perfect crystal analyzer is used and is experimentally much simpler. Future studies will make use of a rapid sample changer allowing the scattering from the sample and a standard material (a material not containing the anomalous scatterer) to be measured alternately at each angle, reducing systematic errors due to beam instability or sample misalignment

  14. Parameter-free extraction of EMCD from an energy-filtered diffraction datacube using multivariate curve resolution

    International Nuclear Information System (INIS)

    Muto, S.; Tatsumi, K.; Rusz, J.

    2013-01-01

    We present a parameter-free method of extraction of the electron magnetic circular dichroism spectra from energy-filtered diffraction patterns measured on a crystalline specimen. The method is based on a multivariate curve resolution technique. The main advantage of the proposed method is that it allows extraction of the magnetic signal regardless of the symmetry and orientation of the crystal, as long as there is a sufficiently strong magnetic component of the signal in the diffraction plane. This method essentially overcomes difficulties in extraction of the EMCD signal caused by complexity of dynamical diffraction effects. - Highlights: ► New method of extraction of EMCD signal using statistical methods (multivariate curve resolution). ► EMCD can be extracted quantitatively regardless of symmetry of crystal or its orientation. ► First principles simulation of EFDIF datacube, including dynamical diffraction effects

  15. Measurement of residual stress in textured Al alloy by neutron diffraction method

    International Nuclear Information System (INIS)

    Okido, S.; Hayashi, M.; Tanaka, K.; Akiniwa, Y.; Minakawa, N.; Morii, Y.

    1999-01-01

    Residual stress generated in a shrunken aluminum alloy specimen, which was prepared for the round robin test conducted by VAMAS (Versailles Project on Advanced Materials and Standards) TWA-20 organized for the purpose of standardizing residual stress measurement methods, was evaluated by a neutron diffraction method. The main purpose of the round robin test was to assess the reproducibility of data obtained with the measurement facilities of the participants. The general standard of the Residual Stress Analyzer (RESA) constructed in the Japan Atomic Energy Research Institute was verified from the measured residual strains, which were equivalent to the values calculated by FEM and values measured by the research facilities in North America. Residual stress was calculated from residual strain in three perpendicular directions. The diffraction intensities were dependent on measurement directions since the prepared specimen possessed texture. Diffraction profiles in directions having a weak diffraction intensity caused an inaccurate evaluation of the residual stress. To solve this problem, a new method for evaluating residual stress with respect to diffraction plane dependency of the elastic constant was applied. The diffraction plane giving the highest intensity among 110, 200, and 220 diffraction was used to evaluate the residual strain in each of three directions. The residual strain obtained on the used diffraction plane was converted to the equivalent strain for the defined diffraction plane using the ratio of elastic constants of these two planes. The developed evaluation method achieved highly accurate measurement and remarkable efficiency in the measurement process. (author)

  16. Grip-pattern recognition: Applied to a smart gun

    NARCIS (Netherlands)

    Shang, X.

    2008-01-01

    In our work the verification performance of a biometric recognition system based on grip patterns, as part of a smart gun for use by the police ocers, has been investigated. The biometric features are extracted from a two-dimensional pattern of the pressure, exerted on the grip of a gun by the hand

  17. Diffraction at TOTEM

    CERN Document Server

    Giani, S; Antchev, G; Aspell, P; Avati, V; Bagliesi, M G; Berardi, V; Berretti, M; Besta, M; Bozzo, M; Brücken, E; Buzzo, A; Cafagna, F; Calicchio, M; Catanesi, M G; Cecchi, R; Ciocci, M A; Dadel, P; Deile, M; Dimovasili, E; Eggert, K; Eremin, V; Ferro, F; Fiergolski, A; García, F; Greco, V; Grzanka, L; Heino, J; Hildén, T; Kaspar, J; Kopal, J; Kundrát, V; Kurvinen, K; Lami, S; Latino, G; Lauhakangas, R; Leszko, R; Lippmaa, E; Lokajícek, M; Lo Vetere, M; Lucas Rodriguez, F; Macrí, M; Magazzù, G; Meucci, M; Minutoli, S; Notarnicola, G; Oliveri, E; Oljemark, F; Orava, R; Oriunno, M; Österberg, K; Pedreschi, E; Petäjäjärvi, J; Prochazka, J; Quinto, M; Radermacher, E; Radicioni, E; Ravotti, F; Rella, G; Robutti, E; Ropelewski, L; Rostkowski, M; Ruggiero, G; Rummel, A; Saarikko, H; Sanguinetti, G; Santroni, A; Scribano, A; Sette, G; Snoeys, W; Spinella, F; Ster, A; Taylor, C; Trummal, A; Turini, N; Whitmore, J; Wu, J; Zalewski, M

    2010-01-01

    The primary objective of the TOTEM experiment at the LHC is the measurement of the total proton-proton cross section with the luminosity-independent method and the study of elastic proton-proton cross-section over a wide |t|-range. In addition TOTEM also performs a comprehensive study of diffraction, spanning from cross-section measurements of individual diffractive processes to the analysis of their event topologies. Hard diffraction will be studied in collaboration with CMS taking advantage of the large common rapidity coverage for charged and neutral particle detection and the large variety of trigger possibilities even at large luminosities. TOTEM will take data under all LHC beam conditions including standard high luminosity runs to maximise its physics reach. This contribution describes the main features of the TOTEM diffractive physics programme including measurements to be made in the early LHC runs.

  18. Low temperature electron microscopy and electron diffraction of the purple membrane of Halobacterium halobium

    International Nuclear Information System (INIS)

    Hayward, S.B.

    1978-09-01

    The structure of the purple membrane of Halobacterium halobium was studied by high resolution electron microscopy and electron diffraction, primarily at low temperature. The handedness of the purple membrane diffraction pattern with respect to the cell membrane was determined by electron diffraction of purple membranes adsorbed to polylysine. A new method of preparing frozen specimens was used to preserve the high resolution order of the membranes in the electron microscope. High resolution imaging of glucose-embedded purple membranes at room temperature was used to relate the orientation of the diffraction pattern to the absolute orientation of the structure of the bacteriorhodopsin molecule. The purple membrane's critical dose for electron beam-induced damage was measured at room temperature and at -120 0 C, and was found to be approximately five times greater at -120 0 C. Because of this decrease in radiation sensitivity, imaging of the membrane at low temperature should result in an increased signal-to-noise ratio, and thus better statistical definition of the phases of weak reflections. Higher resolution phases may thus be extracted from images than can be determined by imaging at room temperature. To achieve this end, a high resolution, liquid nitrogen-cooled stage was built for the JEOL-100B. Once the appropriate technology for taking low dose images at very high resolution has been developed, this stage will hopefully be used to determine the high resolution structure of the purple membrane

  19. Non-diffractive waves

    CERN Document Server

    Hernandez-Figueroa, Hugo E; Recami, Erasmo

    2013-01-01

    This continuation and extension of the successful book ""Localized Waves"" by the same editors brings together leading researchers in non-diffractive waves to cover the most important results in their field and as such is the first to present the current state.The well-balanced presentation of theory and experiments guides readers through the background of different types of non-diffractive waves, their generation, propagation, and possible applications. The authors include a historical account of the development of the field, and cover different types of non-diffractive waves, including Airy

  20. Controlled molecules for X-ray diffraction experiments at free-electron lasers

    International Nuclear Information System (INIS)

    Stern, Stephan

    2013-12-01

    X-ray diffractive imaging is at the very heart of materials science and has been utilized for decades to solve unknown molecular structures. Nowadays, it serves as the key method of structural biology to solve molecular structures of large biological molecules comprising several thousand or even millions of atoms. However, X-ray diffraction from isolated molecules is very weak. Therefore, the regular and periodic arrangement of a huge number of identical copies of a certain molecule of interest within a crystal lattice has been a necessary condition in order to exploit Bragg diffraction of X-rays. This results in a huge increase in scattered signal and a strongly improved signal-to-noise ratio compared to diffraction from non-crystalline samples. The major bottleneck of structural biology is that many of biologically interesting molecules refuse to form crystals of sufficient size to be used at synchrotron X-ray lightsources. However, novel X-ray free-electron lasers (XFELs), which became operational very recently, promise to address this issue. X-ray pulses provided by XFELs are many orders of magnitude more intense than X-ray pulses from a synchrotron source and at the same time as short as only several tens of femtoseconds. Combined with wavelengths in the nm-pm range, XFELs are well-suited to study ultrafast atomic and molecular dynamics. Additionally, the ultrashort pulses can be utilized to circumvent the damage threshold which set a limit to the incident intensity in X-ray diffraction experiments before. At XFELs, though eventually destroying the investigated sample, no significant sample deterioration happens on the ultrashort timescale of the XFEL pulse and the measured diffraction pattern is due to an (almost) unharmed sample. In the framework of this thesis, the approach of utilizing the highly intense XFEL pulses for X-ray diffraction of weakly-scattering non-crystalline samples was taken to the limit of small isolated molecules. X-ray diffraction was

  1. Controlled molecules for X-ray diffraction experiments at free-electron lasers

    Energy Technology Data Exchange (ETDEWEB)

    Stern, Stephan

    2013-12-15

    X-ray diffractive imaging is at the very heart of materials science and has been utilized for decades to solve unknown molecular structures. Nowadays, it serves as the key method of structural biology to solve molecular structures of large biological molecules comprising several thousand or even millions of atoms. However, X-ray diffraction from isolated molecules is very weak. Therefore, the regular and periodic arrangement of a huge number of identical copies of a certain molecule of interest within a crystal lattice has been a necessary condition in order to exploit Bragg diffraction of X-rays. This results in a huge increase in scattered signal and a strongly improved signal-to-noise ratio compared to diffraction from non-crystalline samples. The major bottleneck of structural biology is that many of biologically interesting molecules refuse to form crystals of sufficient size to be used at synchrotron X-ray lightsources. However, novel X-ray free-electron lasers (XFELs), which became operational very recently, promise to address this issue. X-ray pulses provided by XFELs are many orders of magnitude more intense than X-ray pulses from a synchrotron source and at the same time as short as only several tens of femtoseconds. Combined with wavelengths in the nm-pm range, XFELs are well-suited to study ultrafast atomic and molecular dynamics. Additionally, the ultrashort pulses can be utilized to circumvent the damage threshold which set a limit to the incident intensity in X-ray diffraction experiments before. At XFELs, though eventually destroying the investigated sample, no significant sample deterioration happens on the ultrashort timescale of the XFEL pulse and the measured diffraction pattern is due to an (almost) unharmed sample. In the framework of this thesis, the approach of utilizing the highly intense XFEL pulses for X-ray diffraction of weakly-scattering non-crystalline samples was taken to the limit of small isolated molecules. X-ray diffraction was

  2. Study of FeC1{sub 2} by neutron diffraction; Etude de Fe C1{sub 2} par diffraction de neutrons

    Energy Technology Data Exchange (ETDEWEB)

    Herpin, A; Meriel, P [Commissariat a l' Energie Atomique, Saclay (France)

    1959-07-01

    Magnetic measurements have shown that anhydrous ferrous chloride behaves as a metamagnetic at temperatures below 24 deg. K, in other words as an antiferromagnetic sensitive to the action of an external field of moderate strength. The aim of the neutron diffraction study is to determine precisely the arrangement of the magnetic moments, and to follow its evolution as a function of the applied field. (author) [French] Des mesures magnetiques ont montre que le chlorure ferreux anhydre se comporte comme un metamagnetique a une temperature inferieure a 24 deg. K, c'est a dire comme un antiferromagnetique sensible a l'action d'un champ exterieur modere. L'etude par diffraction de neutrons a pour buts de preciser la disposition des moments magnetiques et de suivre son evolution en fonction du champ applique. (auteur)

  3. 64nm pitch metal1 double patterning metrology: CD and OVL control by SEMCD, image based overlay and diffraction based overlay

    Science.gov (United States)

    Ducoté, Julien; Dettoni, Florent; Bouyssou, Régis; Le-Gratiet, Bertrand; Carau, Damien; Dezauzier, Christophe

    2015-03-01

    Patterning process control of advanced nodes has required major changes over the last few years. Process control needs of critical patterning levels since 28nm technology node is extremely aggressive showing that metrology accuracy/sensitivity must be finely tuned. The introduction of pitch splitting (Litho-Etch-Litho-Etch) at 14FDSOInm node requires the development of specific metrologies to adopt advanced process control (for CD, overlay and focus corrections). The pitch splitting process leads to final line CD uniformities that are a combination of the CD uniformities of the two exposures, while the space CD uniformities are depending on both CD and OVL variability. In this paper, investigations of CD and OVL process control of 64nm minimum pitch at Metal1 level of 14FDSOI technology, within the double patterning process flow (Litho, hard mask etch, line etch) are presented. Various measurements with SEMCD tools (Hitachi), and overlay tools (KT for Image Based Overlay - IBO, and ASML for Diffraction Based Overlay - DBO) are compared. Metrology targets are embedded within a block instanced several times within the field to perform intra-field process variations characterizations. Specific SEMCD targets were designed for independent measurement of both line CD (A and B) and space CD (A to B and B to A) for each exposure within a single measurement during the DP flow. Based on those measurements correlation between overlay determined with SEMCD and with standard overlay tools can be evaluated. Such correlation at different steps through the DP flow is investigated regarding the metrology type. Process correction models are evaluated with respect to the measurement type and the intra-field sampling.

  4. Phase sensitive diffraction sensor for high sensitivity refractive index measurement

    Science.gov (United States)

    Kumawat, Nityanand; Varma, Manoj; Kumar, Sunil

    2018-02-01

    In this study a diffraction based sensor has been developed for bio molecular sensing applications and performing assays in real time. A diffraction grating fabricated on a glass substrate produced diffraction patterns both in transmission and reflection when illuminated by a laser diode. We used zeroth order I(0,0) as reference and first order I(0,1) as signal channel and conducted ratiometric measurements that reduced noise by more than 50 times. The ratiometric approach resulted in a very simple instrumentation with very high sensitivity. In the past, we have shown refractive index measurements both for bulk and surface adsorption using the diffractive self-referencing approach. In the current work we extend the same concept to higher diffraction orders. We have considered order I(0,1) and I(1,1) and performed ratiometric measurements I(0,1)/I(1,1) to eliminate the common mode fluctuations. Since orders I(0,1) and I(1,1) behaved opposite to each other, the resulting ratio signal amplitude increased more than twice compared to our previous results. As a proof of concept we used different salt concentrations in DI water. Increased signal amplitude and improved fluid injection system resulted in more than 4 times improvement in detection limit, giving limit of detection 1.3×10-7 refractive index unit (RIU) compared to our previous results. The improved refractive index sensitivity will help significantly for high sensitivity label free bio sensing application in a very cost-effective and simple experimental set-up.

  5. Practical approach to ultrasonic imaging using diffraction tomography

    International Nuclear Information System (INIS)

    Witten, A.; Tuggle, J.; Waag, R.C.

    1988-01-01

    A technique for ultrasonic imaging based on the theory of diffraction tomography is presented. The method utilizes a fixed, circular configuration of transmitters and detectors. This configuration was selected because it avoids many practical limitations associated with the design of a medical imaging device. Practical considerations also motivated the inclusion of effects associated with the transmitter beam pattern rather than pursuing the more conventional approach in which plane-wave illumination is required. In addition, the problem of separately imaging both density and compressibility variations is considered

  6. Practical approach to ultrasonic imaging using diffraction tomography

    Energy Technology Data Exchange (ETDEWEB)

    Witten, A.; Tuggle, J.; Waag, R.C.

    1988-04-01

    A technique for ultrasonic imaging based on the theory of diffraction tomography is presented. The method utilizes a fixed, circular configuration of transmitters and detectors. This configuration was selected because it avoids many practical limitations associated with the design of a medical imaging device. Practical considerations also motivated the inclusion of effects associated with the transmitter beam pattern rather than pursuing the more conventional approach in which plane-wave illumination is required. In addition, the problem of separately imaging both density and compressibility variations is considered.

  7. Transverse Imaging of the Proton in Exclusive Diffractive pp Scattering

    International Nuclear Information System (INIS)

    Christian Weiss; Leonid Frankfurt; Charles Hyde-Wright; Mark Strikman

    2006-01-01

    In a forthcoming paper we describe a new approach to rapidity gap survival (RGS) in the production of high-mass systems (H = dijet, Higgs, etc.) in exclusive double-gap diffractive pp scattering, pp -> p + H + p. It is based on the idea that hard and soft interactions are approximately independent (QCD factorization), and allows us to calculate the RGS probability in a model-independent way in terms of the gluon generalized parton distributions (GPDs) in the colliding protons and the pp elastic scattering amplitude. Here we focus on the transverse momentum dependence of the cross section. By measuring the ''diffraction pattern'', one can perform detailed tests of the interplay of hard and soft interactions, and even extract information about the gluon GPD in the proton from the data

  8. Subreflector extension for improved efficiencies in Cassegrain antennas - GTD/PO analysis. [Geometrical Theory of Diffraction/Physical Optics

    Science.gov (United States)

    Rahmat-Samii, Yahya

    1986-01-01

    Both offset and symmetric Cassegrain reflector antennas are used in satellite and ground communication systems. It is known that the subreflector diffraction can degrade the performance of these reflectors. A geometrical theory of diffraction/physical optics analysis technique is used to investigate the effects of the extended subreflector, beyond its optical rim, on the reflector efficiency and far-field patterns. Representative numerical results are shown for an offset Cassegrain reflector antenna with different feed illumination tapers and subreflector extensions. It is observed that for subreflector extensions as small as one wavelength, noticeable improvements in the overall efficiencies can be expected. Useful design data are generated for the efficiency curves and far-field patterns.

  9. Molecular structure determination from x-ray scattering patterns of laser-aligned symmetric-top molecules

    International Nuclear Information System (INIS)

    Ho, P. J.; Starodub, D.; Saldin, D. K.; Shneerson, V. L.; Ourmazd, A.; Santra, R.

    2009-01-01

    We investigate the molecular structure information contained in the x-ray diffraction patterns of an ensemble of rigid CF 3 Br molecules aligned by an intense laser pulse at finite rotational temperature. The diffraction patterns are calculated at an x-ray photon energy of 20 keV to probe molecular structure at angstrom-scale resolution. We find that a structural reconstruction algorithm based on iterative phase retrieval fails to extract a reliable structure. However, the high atomic number of Br compared with C or F allows each diffraction pattern to be treated as a hologram. Using this approach, the azimuthal projection of the molecular electron density about the alignment axis may be retrieved.

  10. Quantitative microstructure characterization of self-annealed copper films with electron backscatter diffraction

    DEFF Research Database (Denmark)

    Pantleon, Karen; Gholinia, A.; Somers, Marcel A. J.

    2008-01-01

    Electron backscatter diffraction (EBSD) was applied to analyze cross sections of self-annealed copper electrodeposits, for which earlier the kinetics of self-annealing had been investigated by in-situ X-ray diffraction (XRD). The EBSD investigations on the grain size, grain boundary character...... and crystallographic texture of copper films with different thicknesses essentially supplement results from in-situ XRD. Twin relations between neighboring grains were identified from the orientation maps and the observed twin chains confirm multiple twinning in copper electrodeposits as the mechanism...

  11. X-ray powder diffraction camera for high-field experiments

    International Nuclear Information System (INIS)

    Koyama, K; Mitsui, Y; Takahashi, K; Watanabe, K

    2009-01-01

    We have designed a high-field X-ray diffraction (HF-XRD) camera which will be inserted into an experimental room temperature bore (100 mm) of a conventional solenoid-type cryocooled superconducting magnet (10T-CSM). Using the prototype camera that is same size of the HF-XRD camera, a XRD pattern of Si is taken at room temperature in a zero magnetic field. From the obtained results, the expected ability of the designed HF-XRD camera is presented.

  12. Compositional and quantitative microtextural characterization of historic paintings by micro-X-ray diffraction and Raman microscopy.

    Science.gov (United States)

    Romero-Pastor, Julia; Duran, Adrian; Rodríguez-Navarro, Alejandro Basilio; Van Grieken, René; Cardell, Carolina

    2011-11-15

    This work shows the benefits of characterizing historic paintings via compositional and microtextural data from micro-X-ray diffraction (μ-XRD) combined with molecular information acquired with Raman microscopy (RM) along depth profiles in paint stratigraphies. The novel approach was applied to identify inorganic and organic components from paintings placed at the 14th century Islamic University-Madrasah Yusufiyya-in Granada (Spain), the only Islamic University still standing from the time of Al-Andalus (Islamic Spain). The use of μ-XRD to obtain quantitative microtextural information of crystalline phases provided by two-dimensional diffraction patterns to recognize pigments nature and manufacture, and decay processes in complex paint cross sections, has not been reported yet. A simple Nasrid (14th century) palette made of gypsum, vermilion, and azurite mixed with glue was identified in polychromed stuccos. Here also a Christian intervention was found via the use of smalt, barite, hematite, Brunswick green and gold; oil was the binding media employed. On mural paintings and wood ceilings, more complex palettes dated to the 19th century were found, made of gypsum, anhydrite, barite, dolomite, calcite, lead white, hematite, minium, synthetic ultramarine blue, and black carbon. The identified binders were glue, egg yolk, and oil.

  13. Six-axis multi-anvil press for high-pressure, high-temperature neutron diffraction experiments

    Energy Technology Data Exchange (ETDEWEB)

    Sano-Furukawa, A., E-mail: sano.asami@jaea.go.jp; Hattori, T. [Quantum Beam Science Center, Japan Atomic Energy Agency, Ibaraki 319-1195 (Japan); J-PARC Center, Japan Atomic Energy Agency, Ibaraki 319-1195 (Japan); Arima, H. [Institute for Materials Research, Tohoku University, Sendai 980-8577 (Japan); Yamada, A. [The University of Shiga Prefecture, Shiga 522-8533 (Japan); Tabata, S.; Kondo, M.; Nakamura, A. [Sumitomo Heavy Industries Co., Ltd., Ehime 792-0001 (Japan); Kagi, H.; Yagi, T. [Geochemical Research Center, Graduate School of Science, The University of Tokyo, Tokyo 113-0033 (Japan)

    2014-11-15

    We developed a six-axis multi-anvil press, ATSUHIME, for high-pressure and high-temperature in situ time-of-flight neutron powder diffraction experiments. The press has six orthogonally oriented hydraulic rams that operate individually to compress a cubic sample assembly. Experiments indicate that the press can generate pressures up to 9.3 GPa and temperatures up to 2000 K using a 6-6-type cell assembly, with available sample volume of about 50 mm{sup 3}. Using a 6-8-type cell assembly, the available conditions expand to 16 GPa and 1273 K. Because the six-axis press has no guide blocks, there is sufficient space around the sample to use the aperture for diffraction and place an incident slit, radial collimators, and a neutron imaging camera close to the sample. Combination of the six-axis press and the collimation devices realized high-quality diffraction pattern with no contamination from the heater or the sample container surrounding the sample. This press constitutes a new tool for using neutron diffraction to study the structures of crystals and liquids under high pressures and temperatures.

  14. Improving the diffraction of apoA-IV crystals through extreme dehydration

    International Nuclear Information System (INIS)

    Deng, Xiaodi; Davidson, W. Sean; Thompson, Thomas B.

    2011-01-01

    Apolipoprotein A-IV crystals consisted of a long unit-cell edge (540 Å) with a high mosaic spread, making them intractable for X-ray diffraction analysis. Extreme dehydration in 60% PEG 3350 was utilized as a post-crystallization treatment as well a screening method to significantly sharpen the mosaic spread and increase the overall resolution of diffraction. Apolipoproteins are the protein component of high-density lipoproteins (HDL), which are necessary for mobilizing lipid-like molecules throughout the body. Apolipoproteins undergo self-association, especially at higher concentrations, making them difficult to crystallize. Here, the crystallization and diffraction of the core fragment of apolipoprotein A-IV (apoA-IV), consisting of residues 64–335, is presented. ApoA-IV 64–335 crystallized readily in a variety of hexagonal (P6) morphologies with similar unit-cell parameters, all containing a long axis of nearly 550 Å in length. Preliminary diffraction experiments with the different crystal morphologies all resulted in limited streaky diffraction to 3.5 Å resolution. Crystal dehydration was applied to the different morphologies with variable success and was also used as a quality indicator of crystal-growth conditions. The results show that the morphologies that withstood the most extreme dehydration conditions showed the greatest improvement in diffraction. One morphology in particular was able to withstand dehydration in 60% PEG 3350 for over 12 h, which resulted in well defined intensities to 2.7 Å resolution. These results suggest that the approach of integrating dehydration with variation in crystal-growth conditions might be a general technique to optimize diffraction

  15. Overlay improvement methods with diffraction based overlay and integrated metrology

    Science.gov (United States)

    Nam, Young-Sun; Kim, Sunny; Shin, Ju Hee; Choi, Young Sin; Yun, Sang Ho; Kim, Young Hoon; Shin, Si Woo; Kong, Jeong Heung; Kang, Young Seog; Ha, Hun Hwan

    2015-03-01

    To accord with new requirement of securing more overlay margin, not only the optical overlay measurement is faced with the technical limitations to represent cell pattern's behavior, but also the larger measurement samples are inevitable for minimizing statistical errors and better estimation of circumstance in a lot. From these reasons, diffraction based overlay (DBO) and integrated metrology (IM) were mainly proposed as new approaches for overlay enhancement in this paper.

  16. Quantitative damage imaging using Lamb wave diffraction tomography

    International Nuclear Information System (INIS)

    Zhang Hai-Yan; Ruan Min; Zhu Wen-Fa; Chai Xiao-Dong

    2016-01-01

    In this paper, we investigate the diffraction tomography for quantitative imaging damages of partly through-thickness holes with various shapes in isotropic plates by using converted and non-converted scattered Lamb waves generated numerically. Finite element simulations are carried out to provide the scattered wave data. The validity of the finite element model is confirmed by the comparison of scattering directivity pattern (SDP) of circle blind hole damage between the finite element simulations and the analytical results. The imaging method is based on a theoretical relation between the one-dimensional (1D) Fourier transform of the scattered projection and two-dimensional (2D) spatial Fourier transform of the scattering object. A quantitative image of the damage is obtained by carrying out the 2D inverse Fourier transform of the scattering object. The proposed approach employs a circle transducer network containing forward and backward projections, which lead to so-called transmission mode (TMDT) and reflection mode diffraction tomography (RMDT), respectively. The reconstructed results of the two projections for a non-converted S0 scattered mode are investigated to illuminate the influence of the scattering field data. The results show that Lamb wave diffraction tomography using the combination of TMDT and RMDT improves the imaging effect compared with by using only the TMDT or RMDT. The scattered data of the converted A0 mode are also used to assess the performance of the diffraction tomography method. It is found that the circle and elliptical shaped damages can still be reasonably identified from the reconstructed images while the reconstructed results of other complex shaped damages like crisscross rectangles and racecourse are relatively poor. (special topics)

  17. Diffractive optics for industrial and commercial applications

    Energy Technology Data Exchange (ETDEWEB)

    Turunen, J. [Joensuu Univ. (Finland); Wyrowski, F. [eds.] [Jena Univ. (Germany)

    1997-12-31

    The following topics were dealt with: diffractive optics, diffraction gratings, optical system design with diffractive optics, continuous-relief diffractive lenses and microlens arrays, diffractive bifocal intraocular lenses, diffractive laser resonators, diffractive optics for semiconductor lasers, diffractive elements for optical image processing, photorefractive crystals in optical measurement systems, subwavelenth-structured elements, security applications, diffractive optics for solar cells, holographic microlithography. 999 refs.

  18. Applying multilevel model to the relationship of dietary patterns and colorectal cancer: an ongoing case-control study in Córdoba, Argentina.

    Science.gov (United States)

    Pou, Sonia Alejandra; Díaz, María del Pilar; Osella, Alberto Rubén

    2012-09-01

    Scientific literature has consistently shown the effects of certain diets on health but regional variations of dietary habits, and their relationship colorectal cancer (CRC) has been poorly studied in Argentina. Our aims were to identify dietary patterns and estimate their effect on CRC occurrence and to quantify the association between family history of CRC and CRC occurrence by applying multilevel models to estimate and interpret measures of variation. Principal components factor analysis was performed to identify dietary patterns that were then used in a multilevel logistic regression applied to an ongoing case-control data about dietary exposure and CRC occurrence taking into account familiar clustering. Three dietary patterns were identified: "Southern Cone pattern" (red meat, wine, and starchy vegetables), "High-sugar drinks pattern", and "Prudent pattern". The study considered 41 cases and 95 controls. There was a significant promoting effects on CRC of "Southern Cone" (OR 1.5, 95%CI 1.0-2.2) and "High-sugar drinks" (OR 3.8, 95%CI 2.0-7.1) patterns, whereas "Prudent pattern" (OR 0.3, 95%CI 0.2-0.4) showed a significant protective effect at third tertile level. BMI, use of NSAIDs, and to have medical insurance showed significant effects. Variance of the random effect of family history of CRC was highly significant. This novel approach for Argentina showed that Southern Cone and High-sugar drinks patterns were associated with a higher risk of CRC, whereas the Prudent pattern showed a protective effect. There was a significant clustering effect of family history of CRC.

  19. Residual stress characterization of welds using x-ray diffraction techniques

    International Nuclear Information System (INIS)

    Pineault, J.A.; Brauss, M.E.

    1996-01-01

    Neglect of residual stresses created during processes lead to stress corrosion cracking, distortion, fatigue cracking, premature failures in components, and instances of over design. Automated residual stress mapping and truly portable equipment have now made the characterization of residual stresses using x-ray diffraction (XRI) practical. The nondestructive nature of the x-ray diffraction technique has made the tile residual stress characterization of welds a useful tool for process optimization and failure analysis, particularly since components can be measured before and after welding and post welding processes. This paper illustrates the importance of residual stress characterization in welds and presents examples where x-ray diffraction techniques were applied in the characterization of various kinds of welds. arc welds, TIG welds, resistance welds, laser welds and electron beam welds. Numerous techniques are available to help manage potentially harmfull residual stresses created during the welding process thus, the effects of a few example post weld processes such as grinding, heat treating and shot peening are also addressed

  20. Electronic diffraction tomography by Green's functions and singular values decompositions

    International Nuclear Information System (INIS)

    Mayer, A.

    2001-01-01

    An inverse scattering technique is developed to enable a three-dimensional sample reconstruction from the diffraction figures obtained for different sample orientations by electronic projection microscopy, thus performing a diffraction tomography. In its Green's-functions formulation, this technique takes account of all orders of diffraction by performing an iterative reconstruction of the wave function on the observation screen and in the sample. In a final step, these quantities enable a reconstruction of the potential-energy distribution, which is assumed real valued. The method relies on the use of singular values decomposition techniques, thus providing the best least-squares solutions and enabling a reduction of noise. The technique is applied to the analysis of a three-dimensional nanometric sample that is observed in Fresnel conditions with an electron energy of 40 eV. The algorithm turns out to provide results with a mean relative error around 3% and to be stable against random noise

  1. Diffraction at TOTEM

    CERN Document Server

    Antchev, G.; Avati, V.; Bagliesi, M.G.; Berardi, V.; Berretti, M.; Bottigli, U.; Bozzo, M.; Brucken, E.; Buzzo, A.; Cafagna, F.; Calicchio, M.; Catanesi, M.G.; Catastini, P.L.; Cecchi, R.; Ciocci, M.A.; Deile, M.; Dimovasili, E.; Eggert, K.; Eremin, V.; Ferro, F.; Garcia, F.; Giani, S.; Greco, V.; Heino, J.; Hilden, T.; Kaspar, J.; Kopal, J.; Kundrat, V.; Kurvinen, K.; Lami, S.; Latino, G.; Lauhakangas, R.; Lippmaa, E.; Lokajicek, M.; Lo Vetere, M.; Lucas Rodriguez, F.; Macri, M.; Magazzu, G.; Meucci, M.; Minutoli, S.; Niewiadomski, H.; Noschis, E.; Notarnicola, G.; Oliveri, E.; Oljemark, F.; Orava, R.; Oriunno, M.; Osterberg, K.; Palazzi, P.; Pedreschi, E.; Petajajarvi, J.; Quinto, M.; Radermacher, E.; Radicioni, E.; Ravotti, F.; Rella, G.; Robutti, E.; Ropelewski, L.; Ruggiero, G.; Rummel, A.; Saarikko, H.; Sanguinetti, G.; Santroni, A.; Scribano, A.; Sette, G.; Snoeys, W.; Spinella, F.; Squillacioti, P.; Ster, A.; Taylor, C.; Trummal, A.; Turini, N.; Whitmore, J.; Wu, J.

    2009-01-01

    The TOTEM experiment at the LHC measures the total proton-proton cross section with the luminosity-independent method and the elastic proton-proton cross-section over a wide |t|-range. It also performs a comprehensive study of diffraction, spanning from cross-section measurements of individual diffractive processes to the analysis of their event topologies. Hard diffraction will be studied in collaboration with CMS taking advantage of the large common rapidity coverage for charged and neutral particle detection and the large variety of trigger possibilities even at large luminosities. TOTEM will take data under all LHC beam conditions including standard high luminosity runs to maximize its physics reach. This contribution describes the main features of the TOTEM physics programme including measurements to be made in the early LHC runs. In addition, a novel scheme to extend the diffractive proton acceptance for high luminosity runs by installing proton detectors at IP3 is described.

  2. X-ray convergent beam pattern simulation using the Moodie-Wagenfeld equations: 3-beam Laue case

    International Nuclear Information System (INIS)

    Liu, L.; Goodman, P.

    1998-01-01

    Pattern simulations for 3-beam X-ray diffraction are presented, by multi-slice calculations based on Moodie and Wagenfeld's formulation of the X-ray equations, which factorise Maxwell's equations into Dirac format, using circular-polarisation bases. The results are presented in the form of convergent-beam patterns for each diffraction order, using experience gained from CBED (convergent beam electron diffraction) and LACBED (large-angle CBED), since this displays the results in the most compact form. The acronym CBXRAD (convergent-beam X-ray-diffraction) is used for these patterns. Although optics required for the complete patterns is not currently available, capillary focussing is undergoing rapid development, and our simulations define critical angular ranges within reach of current designs. Simulations for light and heavy-atoms structures belonging to the enantiomorphic space-group pair P3 1 21 and P3 2 21, provide clear evidence of chiral interaction between radiation and structure, highlighting divergences from the well studied CBED pattern symmetries. MoKα 1 and TaKα 1 wavelengths were used to minimise absorption for the two structures respectively, although 'anomalous absorption' is always important due to the large thicknesses required (up to 20 mm)

  3. X-ray diffraction and measurement of residual stresses

    International Nuclear Information System (INIS)

    Maeder, G.; Lebrun, J.L.; Corcaud, L.

    1977-01-01

    X-ray diffraction technique is a non destructive method for measuring the residual stresses in mechanical parts. This method, called sin 2 PSI method is investigated. It is applied to the measurement of elastic constants in different directions of crystals of Zr alloy (Zircaloy 4) and Ti alloy (TA6V). Stresses in TA6V sheets welded by TIG and electron beam processes are also studied [fr

  4. Phase-only SLM Generating Variable Patterns Applied in Optical Connection

    International Nuclear Information System (INIS)

    Liu, B H; Wu, L Y; Zhang, J

    2006-01-01

    An adaptive optical communication system is proposed. The system sends spatial information by emitting multiple variable laser beams generated from a programmable diffractive optical element (DOE): phase-only liquid crystal Spatial Light Modulator (SLM). Laser beams carrying signals are programmable by an optimal algorithm based on an iterative Fourier transformation algorithm. The system has the advantage in redundancy of signal by the means of broadcast. It can adaptively seek position and transmit information in parallel

  5. Application of the ellipsoid modeling of the average shape of nanosized crystallites in powder diffraction

    DEFF Research Database (Denmark)

    Katerinopoulou, Anna; Balic Zunic, Tonci; Lundegaard, Lars Fahl

    2012-01-01

    Anisotropic broadening correction in X-ray powder diffraction by an ellipsoidal formula is applied on samples with nanosized crystals. Two cases of minerals with largely anisotropic crystallite shapes are presented. The properly applied formalism not only improves the fitting of the theoretical...

  6. Quantitative firing transformations of a triaxial ceramic by X-ray diffraction methods

    Directory of Open Access Journals (Sweden)

    M. S. Conconi

    2014-12-01

    Full Text Available The firing transformations of traditional (clay based ceramics are of technological and archeological interest, and are usually reported qualitatively or semiquantitatively. These kinds of systems present an important complexity, especially for X-ray diffraction techniques, due to the presence of fully crystalline, low crystalline and amorphous phases. In this article we present the results of a qualitative and quantitative X-ray diffraction Rietveld analysis of the fully crystalline (kaolinite, quartz, cristobalite, feldspars and/or mullite, the low crystalline (metakaolinite and/or spinel type pre-mullite and glassy phases evolution of a triaxial (clay-quartz-feldspar ceramic fired in a wide temperature range between 900 and 1300 ºC. The employed methodology to determine low crystalline and glassy phase abundances is based in a combination of the internal standard method and the use of a nanocrystalline model where the long-range order is lost, respectively. A preliminary sintering characterization was carried out by contraction, density and porosity evolution with the firing temperature. Simultaneous thermo-gravimetric and differential thermal analysis was carried out to elucidate the actual temperature at which the chemical changes occur. Finally, the quantitative analysis based on the Rietveld refinement of the X-ray diffraction patterns was performed. The kaolinite decomposition into metakaolinite was determined quantitatively; the intermediate (980 ºC spinel type alumino-silicate formation was also quantified; the incongruent fusion of the potash feldspar was observed and quantified together with the final mullitization and the amorphous (glassy phase formation.The methodology used to analyze the X-ray diffraction patterns proved to be suitable to evaluate quantitatively the thermal transformations that occur in a complex system like the triaxial ceramics. The evaluated phases can be easily correlated with the processing variables and

  7. Quantitative firing transformations of a triaxial ceramic by X-ray diffraction methods

    International Nuclear Information System (INIS)

    Conconi, M.S.; Gauna, M.R.; Serra, M.F.; Suarez, G.; Aglietti, E.F.; Rendtorff, N.M.

    2014-01-01

    The firing transformations of traditional (clay based) ceramics are of technological and archaeological interest, and are usually reported qualitatively or semi quantitatively. These kinds of systems present an important complexity, especially for X-ray diffraction techniques, due to the presence of fully crystalline, low crystalline and amorphous phases. In this article we present the results of a qualitative and quantitative X-ray diffraction Rietveld analysis of the fully crystalline (kaolinite, quartz, cristobalite, feldspars and/or mullite), the low crystalline (metakaolinite and/or spinel type pre-mullite) and glassy phases evolution of a triaxial (clay-quartz-feldspar) ceramic fired in a wide temperature range between 900 and 1300 deg C. The employed methodology to determine low crystalline and glassy phase abundances is based in a combination of the internal standard method and the use of a nanocrystalline model where the long-range order is lost, respectively. A preliminary sintering characterization was carried out by contraction, density and porosity evolution with the firing temperature. Simultaneous thermo-gravimetric and differential thermal analysis was carried out to elucidate the actual temperature at which the chemical changes occur. Finally, the quantitative analysis based on the Rietveld refinement of the X-ray diffraction patterns was performed. The kaolinite decomposition into metakaolinite was determined quantitatively; the intermediate (980 deg C) spinel type alumino-silicate formation was also quantified; the incongruent fusion of the potash feldspar was observed and quantified together with the final mullitization and the amorphous (glassy) phase formation.The methodology used to analyze the X-ray diffraction patterns proved to be suitable to evaluate quantitatively the thermal transformations that occur in a complex system like the triaxial ceramics. The evaluated phases can be easily correlated with the processing variables and materials

  8. Quantitative firing transformations of a triaxial ceramic by X-ray diffraction methods

    Energy Technology Data Exchange (ETDEWEB)

    Conconi, M.S.; Gauna, M.R.; Serra, M.F. [Centro de Tecnologia de Recursos Minerales y Ceramica (CETMIC), Buenos Aires (Argentina); Suarez, G.; Aglietti, E.F.; Rendtorff, N.M., E-mail: rendtorff@cetmic.unlp.edu.ar [Universidad Nacional de La Plata (UNLP), Buenos Aires (Argentina). Fac. de Ciencias Exactas. Dept. de Quimica

    2014-10-15

    The firing transformations of traditional (clay based) ceramics are of technological and archaeological interest, and are usually reported qualitatively or semi quantitatively. These kinds of systems present an important complexity, especially for X-ray diffraction techniques, due to the presence of fully crystalline, low crystalline and amorphous phases. In this article we present the results of a qualitative and quantitative X-ray diffraction Rietveld analysis of the fully crystalline (kaolinite, quartz, cristobalite, feldspars and/or mullite), the low crystalline (metakaolinite and/or spinel type pre-mullite) and glassy phases evolution of a triaxial (clay-quartz-feldspar) ceramic fired in a wide temperature range between 900 and 1300 deg C. The employed methodology to determine low crystalline and glassy phase abundances is based in a combination of the internal standard method and the use of a nanocrystalline model where the long-range order is lost, respectively. A preliminary sintering characterization was carried out by contraction, density and porosity evolution with the firing temperature. Simultaneous thermo-gravimetric and differential thermal analysis was carried out to elucidate the actual temperature at which the chemical changes occur. Finally, the quantitative analysis based on the Rietveld refinement of the X-ray diffraction patterns was performed. The kaolinite decomposition into metakaolinite was determined quantitatively; the intermediate (980 deg C) spinel type alumino-silicate formation was also quantified; the incongruent fusion of the potash feldspar was observed and quantified together with the final mullitization and the amorphous (glassy) phase formation.The methodology used to analyze the X-ray diffraction patterns proved to be suitable to evaluate quantitatively the thermal transformations that occur in a complex system like the triaxial ceramics. The evaluated phases can be easily correlated with the processing variables and materials

  9. Design and fabrication of directional diffractive device on glass substrate for multiview holographic 3D display

    Science.gov (United States)

    Su, Yanfeng; Cai, Zhijian; Liu, Quan; Zou, Wenlong; Guo, Peiliang; Wu, Jianhong

    2018-01-01

    Multiview holographic 3D display based on the nano-grating patterned directional diffractive device can provide 3D images with high resolution and wide viewing angle, which has attracted considerable attention. However, the current directional diffractive device fabricated on the photoresist is vulnerable to damage, which will lead to the short service life of the device. In this paper, we propose a directional diffractive device on glass substrate to increase its service life. In the design process, the period and the orientation of the nano-grating at each pixel are carefully calculated accordingly by the predefined position of the viewing zone, and the groove parameters are designed by analyzing the diffraction efficiency of the nano-grating pixel on glass substrate. In the experiment, a 4-view photoresist directional diffractive device with a full coverage of pixelated nano-grating arrays is efficiently fabricated by using an ultraviolet continuously variable spatial frequency lithography system, and then the nano-grating patterns on the photoresist are transferred to the glass substrate by combining the ion beam etching and the reactive ion beam etching for controlling the groove parameters precisely. The properties of the etched glass device are measured under the illumination of a collimated laser beam with a wavelength of 532nm. The experimental results demonstrate that the light utilization efficiency is improved and optimized in comparison with the photoresist device. Furthermore, the fabricated device on glass substrate is easier to be replicated and of better durability and practicability, which shows great potential in the commercial applications of 3D display terminal.

  10. Strain mapping under spherical indentations using transmission Kikuchi diffraction

    International Nuclear Information System (INIS)

    Cackett, A.; Hardie, C.; Wilkinson, A.; Dicks, K.

    2015-01-01

    Due to restrictions on both the specimen volumes available and the activity levels research facilities can handle, testing techniques on the micron-scale are very attractive for the study of irradiated material. However, the results of such small tests are convoluted by plasticity size-effects. Spherical nano-indentation is increasingly used to probe irradiated material, but to characterise the area of plastic deformation surrounding indentations a method capable of providing crystallographic information at extremely high spatial resolution is required. Transmission Kikuchi Diffraction (TKD) is a novel diffraction technique that can be performed in a scanning electron microscope. Using this technique, spatial resolutions below 10 nm have been achieved. Initial results, shown here, demonstrate the use of TKD in mapping the lattice rotations caused by indentation produced with a spherical diamond tip. With the addition of strain mapping software the plastic zone size was also evaluated for the first time using diffraction patterns generated via TKD. For a tip of radius 15 μm, inserted into Fe to a strain of 0.07, the plastic zone was observed to extend 1.3 μm to either side of the incident location of indentation and the deformation depth was approximately 0.5 μm. (authors)

  11. Diffraction radiation from relativistic particles

    CERN Document Server

    Potylitsyn, Alexander Petrovich; Strikhanov, Mikhail Nikolaevich; Tishchenko, Alexey Alexandrovich

    2010-01-01

    This book deals with diffraction radiation, which implies the boundary problems of electromagnetic radiation theory. Diffraction radiation is generated when a charged particle moves in a vacuum near a target edge. Diffraction radiation of non-relativistic particles is widely used to design intense emitters in the cm wavelength range. Diffraction radiation from relativistic charged particles is important for noninvasive beam diagnostics and design of free electron lasers based on Smith-Purcell radiation which is diffraction radiation from periodic structures. Different analytical models of diffraction radiation and results of recent experimental studies are presented in this book. The book may also serve as guide to classical electrodynamics applications in beam physics and electrodynamics. It can be of great use for young researchers to develop skills and for experienced scientists to obtain new results.

  12. Diffraction radiation from relativistic particles

    International Nuclear Information System (INIS)

    Potylitsyn, Alexander Petrovich; Ryazanov, Mikhail Ivanovich; Strikhanov, Mikhail Nikolaevich; Tishchenko, Alexey Alexandrovich

    2010-01-01

    This book deals with diffraction radiation, which implies the boundary problems of electromagnetic radiation theory. Diffraction radiation is generated when a charged particle moves in a vacuum near a target edge. Diffraction radiation of non-relativistic particles is widely used to design intense emitters in the cm wavelength range. Diffraction radiation from relativistic charged particles is important for noninvasive beam diagnostics and design of free electron lasers based on Smith-Purcell radiation which is diffraction radiation from periodic structures. Different analytical models of diffraction radiation and results of recent experimental studies are presented in this book. The book may also serve as guide to classical electrodynamics applications in beam physics and electrodynamics. It can be of great use for young researchers to develop skills and for experienced scientists to obtain new results. (orig.)

  13. Acoustic non-diffracting Airy beam

    International Nuclear Information System (INIS)

    Lin, Zhou; Guo, Xiasheng; Tu, Juan; Ma, Qingyu; Wu, Junru; Zhang, Dong

    2015-01-01

    The acoustic non-diffracting Airy beam as its optical counterpart has unique features of self-bending and self-healing. The complexity of most current designs handicaps its applications. A simple design of an acoustic source capable of generating multi-frequency and broad-band acoustic Airy beam has been theoretically demonstrated by numerical simulations. In the design, a piston transducer is corrugated to induce spatial phase variation for transducing the Airy function. The piston's surface is grooved in a pattern that the width of each groove corresponds to the half wavelength of Airy function. The resulted frequency characteristics and its dependence on the size of the piston source are also discussed. This simple design may promote the wide applications of acoustic Airy beam particularly in the field of medical ultrasound

  14. Crystal structure of the martensite phase in the ferromagnetic shape memory compound Ni2MnGa studied by electron diffraction

    International Nuclear Information System (INIS)

    Fukuda, Takashi; Kushida, Hiroaki; Todai, Mitsuharu; Kakeshita, Tomoyuki; Mori, Hirotaro

    2009-01-01

    The electron diffraction patterns of Ni 2 MnGa show six satellites at ±q M , ±2q M and ±3q M , with q M = 0.427(5) g 22 -bar 0 between fundamental reflections in the martensite phase, and two satellites at ±q I , with q I = 0.340(5) g 22 -bar 0 in the intermediate phase, meaning that these phases have incommensurate structures. In addition, the diffraction pattern of the intermediate phase continuously changes to that of the parent phase via the X-phase, suggesting the existence of a multicritical phenomenon.

  15. A structural investigation into the compaction behavior of pharmaceutical composites using powder X-ray diffraction and total scattering analysis.

    Science.gov (United States)

    Moore, Michael D; Steinbach, Alison M; Buckner, Ira S; Wildfong, Peter L D

    2009-11-01

    To use advanced powder X-ray diffraction (PXRD) to characterize the structure of anhydrous theophylline following compaction, alone, and as part of a binary mixture with either alpha-lactose monohydrate or microcrystalline cellulose. Compacts formed from (1) pure theophylline and (2) each type of binary mixture were analyzed intact using PXRD. A novel mathematical technique was used to accurately separate multi-component diffraction patterns. The pair distribution function (PDF) of isolated theophylline diffraction data was employed to assess structural differences induced by consolidation and evaluated by principal components analysis (PCA). Changes induced in PXRD patterns by increasing compaction pressure were amplified by the PDF. Simulated data suggest PDF dampening is attributable to molecular deviations from average crystalline position. Samples compacted at different pressures were identified and differentiated using PCA. Samples compacted at common pressures exhibited similar inter-atomic correlations, where excipient concentration factored in the analyses involving lactose. Practical real-space structural analysis of PXRD data by PDF was accomplished for intact, compacted crystalline drug with and without excipient. PCA was used to compare multiple PDFs and successfully differentiated pattern changes consistent with compaction-induced disordering of theophylline as a single component and in the presence of another material.

  16. Study of FeC1{sub 2} by neutron diffraction; Etude de Fe C1{sub 2} par diffraction de neutrons

    Energy Technology Data Exchange (ETDEWEB)

    Herpin, A.; Meriel, P. [Commissariat a l' Energie Atomique, Saclay (France)

    1959-07-01

    Magnetic measurements have shown that anhydrous ferrous chloride behaves as a metamagnetic at temperatures below 24 deg. K, in other words as an antiferromagnetic sensitive to the action of an external field of moderate strength. The aim of the neutron diffraction study is to determine precisely the arrangement of the magnetic moments, and to follow its evolution as a function of the applied field. (author) [French] Des mesures magnetiques ont montre que le chlorure ferreux anhydre se comporte comme un metamagnetique a une temperature inferieure a 24 deg. K, c'est a dire comme un antiferromagnetique sensible a l'action d'un champ exterieur modere. L'etude par diffraction de neutrons a pour buts de preciser la disposition des moments magnetiques et de suivre son evolution en fonction du champ applique. (auteur)

  17. Probing the structure of heterogeneous diluted materials by diffraction tomography.

    Science.gov (United States)

    Bleuet, Pierre; Welcomme, Eléonore; Dooryhée, Eric; Susini, Jean; Hodeau, Jean-Louis; Walter, Philippe

    2008-06-01

    The advent of nanosciences calls for the development of local structural probes, in particular to characterize ill-ordered or heterogeneous materials. Furthermore, because materials properties are often related to their heterogeneity and the hierarchical arrangement of their structure, different structural probes covering a wide range of scales are required. X-ray diffraction is one of the prime structural methods but suffers from a relatively poor detection limit, whereas transmission electron analysis involves destructive sample preparation. Here we show the potential of coupling pencil-beam tomography with X-ray diffraction to examine unidentified phases in nanomaterials and polycrystalline materials. The demonstration is carried out on a high-pressure pellet containing several carbon phases and on a heterogeneous powder containing chalcedony and iron pigments. The present method enables a non-invasive structural refinement with a weight sensitivity of one part per thousand. It enables the extraction of the scattering patterns of amorphous and crystalline compounds with similar atomic densities and compositions. Furthermore, such a diffraction-tomography experiment can be carried out simultaneously with X-ray fluorescence, Compton and absorption tomographies, enabling a multimodal analysis of prime importance in materials science, chemistry, geology, environmental science, medical science, palaeontology and cultural heritage.

  18. PABRE-Proj: applying patterns in requirements elicitation

    OpenAIRE

    Palomares Bonache, Cristina; Quer Bosor, Maria Carme; Franch Gutiérrez, Javier

    2013-01-01

    Software requirement patterns have been proposed as a type of artifact for fostering requirements reuse. In this paper, we present PABRE-Proj, a tool aimed at supporting requirements elicitation and specification. Peer Reviewed

  19. Diffraction dissociation

    International Nuclear Information System (INIS)

    Abarbanel, H.

    1972-01-01

    An attempt is made to analyse the present theoretical situation in the field of diffraction scattering. Two not yet fully answered questions related with a typical diffraction process AB→CD, namely: what is the structure of the transition matrix elements, and what is the structure of the exchange mechanism responsible for the scattering, are formulated and various proposals for answers are reviewed. Interesting general statement that the products (-1)sup(J)P, where J and P are respectively spin and parity, is conserved at each vertex has been discussed. The exchange mechanism in diffractive scattering has been considered using the language of the complex J-plane as the most appropriate. The known facts about the exchange mechanism are recalled and several routs to way out are proposed. The idea to consider the moving pole and associated branch points as like a particle and the associated two and many particle unitarity cuts is described in more details. (S.B.)

  20. Crystallite size and lattice distortion of human dental enamel estimated from the integral width of x-ray diffraction peak profile

    International Nuclear Information System (INIS)

    Maruyama, Fumiaki; Sakae, Toshiro

    2000-01-01

    Crystallite size and lattice distortion of human dental enamel were estimated by peak profile analysis using x-ray diffraction pattern. Firstly, noises were removed from x-ray diffraction pattern, and deconvolution of overlapping peaks and determination of baseline level were carried out. Then, the instrumental peak broadening and effect of overlapping Kα1 and Kα2 were eliminated to obtain pure peak profile using the Stokes's Fourier method. The integral width method was applied for estimation of crystallite size and 'upper-limit of distortion', assuming the peak profile as Cauchy function. The estimated crystallite size and distortion were ca. 210 A and ca. 0.4% in the a-axis direction and ca. 550 A and ca. 0.7% in the c-axis direction, respectively. The crystallite size value along the a-axis was almost the same to the previously reported values, but the value for along the c-axis was nearly half of the reported values. The crystallite size in this study means the size of coherent domain in contrast to the size of particle which may contain several domains in the case of enamel crystals. The results suggest that human enamel crystals grow in their size along the c-axis by multiplication, fusion of crystallites. It was notable that the distortion value was larger in the c-axis direction. The phenomenon may partly be due to the high carbonate ion content of enamel crystals and partly due to crystal growth mechanism. (author)