WorldWideScience

Sample records for dental x-ray film

  1. 21 CFR 872.1905 - Dental x-ray film holder.

    Science.gov (United States)

    2010-04-01

    ... 21 Food and Drugs 8 2010-04-01 2010-04-01 false Dental x-ray film holder. 872.1905 Section 872...) MEDICAL DEVICES DENTAL DEVICES Diagnostic Devices § 872.1905 Dental x-ray film holder. (a) Identification. A dental x-ray film holder is a device intended to position and to hold x-ray film inside the...

  2. Lead foil in dental X-ray film: Backscattering rejection or image intensifier?

    Energy Technology Data Exchange (ETDEWEB)

    Hönnicke, M.G., E-mail: marcelo.honnicke@unila.edu.br [Universidade Federal da Integração Latino-Americana, Foz do Iguaçu (Brazil); Delben, G.J. [Faculdade de Tecnologia Tupy, Curitiba (Brazil); Godoi, W.C. [Universidade Tecnológica Federal do Paraná, Curitiba (Brazil); Swinka-Filho, V. [Instituto de Tecnologia para o Desenvolvimento – LACTEC, Curitiba (Brazil)

    2014-11-01

    Dental X-ray films are still largely used due to sterilization issues, simplicity and, mainly, economic reasons. These films almost always are double coated (double emulsion) and have a lead foil in contact with the film for X-ray backscattering rejection. Herein we explore the use of the lead foil as an image intensifier. In these studies, spatial resolution was investigated when images were acquired on the dental X-ray films with and without the lead foil. Also, the lead foil was subjected to atomic analysis (fluorescent measurements) and structure analysis (X-ray diffraction). We determined that the use of the lead foil reduces the exposure time, however, does not affect the spatial resolution on the acquired images. This suggests that the fluorescent radiation spread is smaller than the grain sizes of the dental X-ray films.

  3. A comparison of Flow and Kodak dental X-ray films by means of perceptibility curves

    Energy Technology Data Exchange (ETDEWEB)

    Svenson, B.; Petersson, A. (Centre of Oral Health Sciences, Univ. of Lund, Malmoe (Sweden))

    1993-01-01

    Flow D- and E-speed group dental X-ray films (DX-58 and EX-58) have recently been introduced to the market. By means of perceptibility curves these films were compared with commonly used dental X-ray films (Kodak Ultraspeed and Ektaspeed). No major differences between the films were found with regard to contrast and the subjectively assessed number of small contrast differences. The exposure for EX-58 had to be lowered by 66% and Ektaspeed by 39% compared with Ultraspeed film to obtain the same density. DX-58 and Ultraspeed were of the same sensitivity. 26 refs., 3 figs., 3 tabs.

  4. Panoramic Dental X-Ray

    Science.gov (United States)

    ... Physician Resources Professions Site Index A-Z Panoramic Dental X-ray Panoramic dental x-ray uses a very small dose of ... x-ray , is a two-dimensional (2-D) dental x-ray examination that captures the entire mouth ...

  5. Panoramic Dental X-Ray

    Science.gov (United States)

    ... Physician Resources Professions Site Index A-Z Panoramic Dental X-ray Panoramic dental x-ray uses a ... Your e-mail address: Personal message (optional): Bees: Wax: Notice: RadiologyInfo respects your privacy. Information entered here ...

  6. Dental x-rays

    Science.gov (United States)

    ... X-rays are a form of high energy electromagnetic radiation. The x-rays penetrate the body to form ... for detecting cavities, unless the decay is very advanced and deep. Many ... The amount of radiation given off during the procedure is less than ...

  7. IDEFIX: identification of dental fixtures in intraoral x rays

    Science.gov (United States)

    Lehmann, Thomas M.; Schmitt, Walter; Horn, Harald; Hillen, Walter

    1996-04-01

    In dental implantology more than one hundred enossal implant systems are in use. Once embedded, the dental x-ray examination is the most important tool for determining implants' producer, name, and type. In this paper, we present a system for automatic detection and identification of dental fixtures in intraoral x rays (IDEFIX) combining common direct digital image acquisition techniques with specially designed image analysis. IDEFIX can process any digital radiograph (e.g. RVG, Sens-A-Ray, Schick, Sidexis, Digora) as well as digitized dental films. A reference database has been generated by precise measurement on the implant systems used so far (eight implants) including parameters like length, diameter, and cross section area. After binarization of the current digital x-ray image, a parameter set is extracted from each detected object applying mathematical morphology. All objects are classified using a simplified nearest neighbor method and the Euclidean distance metric. If the distance of the objects' parameter set to one of the reference sets is below a given threshold, name and type of the identified dental fixture are displayed on the screen. Otherwise, the actual object will be rejected as a no-implant. IDEFIX has been evaluated by processing various in-vitro acquired radiographs. Different implants were classified captured with identical conditions as well as acquired varying the angulation of the x-ray tube. It is shown that misangulations up to twenty degrees are tolerable preserving correct identification. Other image structures like teeth or fillings result in large distances to all reference parameter sets and, therefore, they are reliably recognized as non-implants.

  8. Intraoral radiology in general dental practices. A comparison of digital and film-based X-ray systems with regard to radiation protection and dose reduction

    Energy Technology Data Exchange (ETDEWEB)

    Anissi, H.D. [Ulm Univ. (Germany). Dentistry; Geibel, M.A. [Ulm Univ. (Germany). Dept. of Dentomaxillofacial Surgery

    2014-08-15

    Purpose: The purpose of this study was to gain insight into the distribution and application of digital intraoral radiographic techniques within general dental practices and to compare these with film-based systems in terms of patient dose reduction. Materials and Methods: 1100 questionnaires were handed out to general dental practitioners. Data was analyzed with respect to the type of system by using descriptive statistics and nonparametric tests, i.e. Kruskal-Wallis, Mann-Whitney and chi-square test (SPSS 20). Results: 64% of the questioned dentists still use film-based radiology, 23% utilize storage phosphor plate (SPP) systems and 13% use a charge-coupled device (CCD). A strong correlation between the number of dentists working in a practice and the use of digital dental imaging was observed. Almost 3/4 of the film users work with E- or F-speed film. 45% of them refuse to change to a digital system. The use of lead aprons was popular, while only a minority preferred thyroid shields and rectangular collimators. A fourfold reduction of exposure time from D-speed film to CCD systems was observed. Due to detector size and positioning errors, users of CCD systems take significantly more single-tooth radiographs in total. Considering the number of radiographs per patient, there is only a slight tendency towards more X-rays with CCD systems. Up to image generation, digital systems seem to be as or even more difficult to handle than film-based systems, while their handling was favored after radiographic exposure. Conclusion: Despite a slight increase of radiographs taken with CCD systems, there is a significant dosage reduction. Corresponding to the decrease in exposure time, the patient dose for SPP systems is reduced to one half compared to film. The main issues in CCD technology are positioning errors and the size of the X-ray detectors which are difficult to eliminate. The usage of radiation protection measures still needs to be improved. (orig.)

  9. [Use and evaluation of X-ray films produced by WZF Foton for occlusal radiograms].

    Science.gov (United States)

    Mlosek, K; Bończyk, J; Winnicka-Szmielew, B; Gusiew, J

    1989-02-01

    Sensitimetric properties are described of X-ray films for taking occlusal radiograms: Dental DX, RF-42, Ultra-Speed, XR-11 KS (XM). The film Dental DX was estimated on the basis of examination of a skull specimen and clinical material. The sensitivity of the film Dental DX was 400% higher than that of the generally used RF-42 film.

  10. X-ray film spectroscopy

    Energy Technology Data Exchange (ETDEWEB)

    Rodriguez-Trelles, F.; Caputo, M.C. (Buenos Aires Univ. Nacional (Argentina). Lab. de Fisica del Plasma; Ministerio de Defensa, Buenos Aires (Argentina). DIGID)

    1982-02-15

    A multi-pinhole camera using film as a detector is described. Separation of variables in the master-curve sense leads to integral exposure equations which are solved by regularization. A filter-selection method is used to maximize the information content of a given set of measurements. Numerical simulation examples of the unfolding procedure are shown and the inversion error is evaluated. The essential role of absorption edges of filters and detectors for increasing the information content is emphasized and the method is compared with other absorption-edge techniques. A discussion of the present limitations of the method is given.

  11. Digital Dental X-ray Database for Caries Screening

    Science.gov (United States)

    Rad, Abdolvahab Ehsani; Rahim, Mohd Shafry Mohd; Rehman, Amjad; Saba, Tanzila

    2016-06-01

    Standard database is the essential requirement to compare the performance of image analysis techniques. Hence the main issue in dental image analysis is the lack of available image database which is provided in this paper. Periapical dental X-ray images which are suitable for any analysis and approved by many dental experts are collected. This type of dental radiograph imaging is common and inexpensive, which is normally used for dental disease diagnosis and abnormalities detection. Database contains 120 various Periapical X-ray images from top to bottom jaw. Dental digital database is constructed to provide the source for researchers to use and compare the image analysis techniques and improve or manipulate the performance of each technique.

  12. Evaluation of the Beam Quality of Intraoral X-ray Equipment using Intraoral Standard Films

    Energy Technology Data Exchange (ETDEWEB)

    Lee, Sang Sub; Kwon, Hyok Rak; Sim, Woo Hyoun; Oh, Seung Hyoun; Lee, Ji Youn; Jeon, Kug Jin; Kim, Kee Deog; Park, Chang Seo [Dept. of Oral and Maxillofacial Radiology, College of Dentistry, Yensei University, Seoul (Korea, Republic of)

    2000-09-15

    This study was to evaluate the beam quality of intraoral X-ray equipment used at Yonsei University Dental Hospital (YUDH) using the half value layer (HVL) and the characteristic curve of intraoral standard X-ray film. The study was done using the intraoral X-ray equipment used at each clinical department at YUDH. Aluminum filter was used to determine the HVL. Intraoral standard film was used to get the characteristic curve of each intraoral X-ray equipment. Most of the HVLs of intraoral X-ray equipment were higher than the least recommended thickness, but the REX 601 model used at the operative dentistry department and the X-707 model used at the pediatric dentistry department had HVLs lower than the recommended thickness. The slopes of the characteristic curves of films taken using the PANPAS 601 model and REX 601 model at operative dentistry department, the X-70S model of prosthodontic dentistry department, and the REX 601 model at the student clinic were relatively low. HVL and the characteristic curve of X-ray film can be used to evaluate the beam quality of intraoral X-ray equipment. In order to get the best X-ray films with the least radiation exposure to patients and best diagnostic information in clinical dentistry, X-ray equipment should be managed in the planned and organized fashion.

  13. Microbeam x-ray diffraction analysis of dental calculus.

    Science.gov (United States)

    Kani, T; Kani, M; Moriwaki, Y; Doi, Y

    1983-02-01

    The crystalline components of human dental calculus were investigated using microbeam x-ray diffraction analysis. Hydroxyapatite and octacalcium phosphate were most frequently found in that portion having porous and zonal structure. In the portion of the homogeneous illustration showing high calcification, whitlockite is a main component. Brushite was unexpectedly rare, and no calcite was detected in any portion of human dental calculus. The mechanism of the formation of dental calculus being considered in this paper is that octacalcium phosphate or brushite is formed during the initial stage of calcification of dental plaque, and is gradually hydrolyzed and transformed into hydroxyapatite and/or whitlockite.

  14. 21 CFR 872.1840 - Dental x-ray position indicating device.

    Science.gov (United States)

    2010-04-01

    ... 21 Food and Drugs 8 2010-04-01 2010-04-01 false Dental x-ray position indicating device. 872.1840... (CONTINUED) MEDICAL DEVICES DENTAL DEVICES Diagnostic Devices § 872.1840 Dental x-ray position indicating device. (a) Identification. A dental x-ray position indicating device is a device, such as a collimator...

  15. 21 CFR 872.1820 - Dental x-ray exposure alignment device.

    Science.gov (United States)

    2010-04-01

    ... 21 Food and Drugs 8 2010-04-01 2010-04-01 false Dental x-ray exposure alignment device. 872.1820... (CONTINUED) MEDICAL DEVICES DENTAL DEVICES Diagnostic Devices § 872.1820 Dental x-ray exposure alignment device. (a) Identification. A dental x-ray exposure alignment device is a device intended to position...

  16. Impact of X-ray irradiation on PMMA thin films

    Energy Technology Data Exchange (ETDEWEB)

    Iqbal, Saman, E-mail: saman.khan343@gmail.com [Physics Department, University of Engineering and Technology, Lahore (Pakistan); Rafique, Muhammad Shahid [Physics Department, University of Engineering and Technology, Lahore (Pakistan); Anjum, Safia [Physics Department, Lahore College for Woman University, Lahore (Pakistan); Hayat, Asma [Physics Department, University of Engineering and Technology, Lahore (Pakistan); Iqbal, Nida [Faculty of Biomedical Engineering and Health Science, Universiti Teknologi Malaysia (UTM) (Malaysia)

    2012-10-15

    Highlights: Black-Right-Pointing-Pointer PMMA thin films were deposited at 300 Degree-Sign C and 500 Degree-Sign C using PLD technique. Black-Right-Pointing-Pointer These films were irradiated with different fluence of laser produced X-rays. Black-Right-Pointing-Pointer Irradiation affects the ordered packing as well as surface morphology of film. Black-Right-Pointing-Pointer Hardness of film decreases up to certain value of X-ray fluence. Black-Right-Pointing-Pointer Absorption in UV-visible range exhibits a non linear behavior. - Abstract: The objective of this project is to explore the effect of X-ray irradiation of thin polymeric films deposited at various substrate temperatures. pulsed laser deposition (PLD) technique is used for the deposition of PMMA thin films on glass substrate at 300 Degree-Sign C and 500 Degree-Sign C. These films have been irradiated with various X-rays fluences ranging from 2.56 to 5.76 mJ cm{sup -2}. Characterization of the films (before and after the irradiation) is done with help of X-ray Diffractrometer, Optical Microscope, Vickers hardness tester and UV-vis spectroscopy techniques. From XRD data, it is revealed that ordered packing has been improved for the films deposited at 300 Degree-Sign C. However after irradiation the films exhibited the amorphous behavior regardless of the X-ray fluence. Film deposited at 500 Degree-Sign C shows amorphous structure before and after irradiation. Hardness and particle size of thin film have also increased with the increasing substrate temperature. However, the irradiation has reverse effect i.e. the particle size as well as the hardness has reduced. Irradiation has also enhanced the absorption in the UV-visible region.

  17. Hard X-ray quantum optics in thin films nanostructures

    Energy Technology Data Exchange (ETDEWEB)

    Haber, Johann Friedrich Albert

    2017-05-15

    This thesis describes quantum optical experiments with X-rays with the aim of reaching the strong-coupling regime of light and matter. We make use of the interaction which arises between resonant matter and X-rays in specially designed thin-film nanostructures which form X-ray cavities. Here, the resonant matter are Tantalum atoms and the Iron isotope {sup 57}Fe. Both limit the number of modes available to the resonant atoms for interaction, and enhances the interaction strength. Thus we have managed to observe a number of phenomena well-known in quantum optics, which are the building blocks for sophisticated applications in e.g. metrology. Among these are the strong coupling of light and matter and the concurrent exchange of virtual photons, often called Rabi oscillations. Furthermore we have designed and tested a type of cavity hitherto unused in X-ray optics. Finally, we develop a new method for synchrotron Moessbauer spectroscopy, which not only promises to yield high-resolution spectra, but also enables the retrieval of the phase of the scattered light. The results open new avenues for quantum optical experiments with X-rays, particularly with regards to the ongoing development of high-brilliance X-ray free-electron lasers.

  18. X-ray sensitivity measurements on CVD diamond film detectors

    Energy Technology Data Exchange (ETDEWEB)

    Foulon, F.; Pochet, T. [CEA Centre d`Etudes de Saclay, 91 - Gif-sur-Yvette (France). Dept. d`Electronique et d`Instrumentation Nucleaire; Gheeraert, E. [Centre National de la Recherche Scientifique (CNRS), 38 - Grenoble (France)

    1993-12-31

    Microwave chemical vapor deposited (CVD) diamond films have been used to fabricate radiation detectors. The polycrystalline diamond films have a resistivity of 10{sup 12} ohm.cm and carrier mobility and lifetime of about 280 cm{sup 2}/V.s and 530 ps. The detector response to laser pulses (355, 532 and 1064 nm), X-ray flux (15-50 keV) and alpha particles ({sup 241}Am, 5.49 MeV) has been investigated. The response speed of the detector is in the 100 ps range. A sensitivity of about 3 x 10{sup -10} A/V.Gy.s was measured under 50 keV X-ray flux. The detector current response to X-ray flux is almost linear. It is also shown that CVD diamond detectors can be used for alpha particle counting. (authors). 9 figs., 25 refs.

  19. Magnetic x-ray dichroism in ultrathin epitaxial films

    Energy Technology Data Exchange (ETDEWEB)

    Tobin, J.G.; Goodman, K.W. [Lawrence Berkeley National Lab., CA (United States); Cummins, T.R. [Univ. of Missouri, Rolla, MO (United States)] [and others

    1997-04-01

    The authors have used Magnetic X-ray Linear Dichroism (MXLD) and Magnetic X-ray Circular Dichroism (MXCD) to study the magnetic properties of epitaxial overlayers in an elementally specific fashion. Both MXLD and MXCD Photoelectron Spectroscopy were performed in a high resolution mode at the Spectromicroscopy Facility of the ALS. Circular Polarization was obtained via the utilization of a novel phase retarder (soft x-ray quarter wave plate) based upon transmission through a multilayer film. The samples were low temperature Fe overlayers, magnetic alloy films of NiFe and CoNi, and Gd grown on Y. The authors results include a direct comparison of high resolution angle resolved Photoelectron Spectroscopy performed in MXLD and MXCD modes as well as structural studies with photoelectron diffraction.

  20. MTF Optimization in Digital Dental X-ray Systems

    CERN Document Server

    Costa, E T; Costa, Eduardo Tavares; Albuquerque, Jorge Andre Girao

    2003-01-01

    In this work, we have studied the MTF optimisation relative to the detector aperture of four digital dental X-ray image systems: 1) Digora and Denoptix systems, based on PSPL detectors; 2) CDR and Sens-A-Ray 2000, based on CCD detectors. The MTF was evaluated by ERF method and linearized as a Gaussian process. The CCD based systems presented Gaussian characteristics. The PSPL based systems presented a composition of two Gaussian processes. We conclude that one process is due to the laser and stimulated light scattering inside the PSPL plate and the other is due to the laser beam focal aperture. Matching focal aperture to laser scattering allows the optimization of the PSPL systems resolution. An optimal pixel width found to be 62 um.

  1. A miniature X-ray tube based on carbon nanotube for an intraoral dental radiography

    Energy Technology Data Exchange (ETDEWEB)

    Kim, Hyun Jin; Park, Han Beom; Lee, Ju Hyuk; Cho, Sung Oh [KAIST, Daejeon (Korea, Republic of)

    2016-05-15

    The number of human teeth that can be radiographically taken is limited. Moreover, at least two X-ray shots are required to get images of teeth from both sides of the mouth. In order to overcome the disadvantages of conventional dental radiography, a dental radiograph has been proposed in which an X-ray tube is inserted into the mouth while an X-ray detector is placed outside the mouth. The miniature X-ray tube is required small size to insert into the mouth. Recently, we have fabricated a miniature x-ray tube with the diameter of 7 mm using a carbon nanotube (CNT) field. But, commercialized miniature X-ray tube were adopted a thermionic type using tungsten filament. The X-ray tubes adopted thermionic emission has a disadvantage of increasing temperature of x-ray tube. So it need to cooling system to cool x-ray tube. On the other hands, X-ray tubes adopted CNT field emitters don't need cooling systems because electrons are emitted from CNT by applying high voltage without heating. We have developed the miniature x-ray tube that produce x-ray with uniform spatial distribution based on carbon nanotube field emitters. The fabricated miniature x-ray tube can be stably and reliably operated at 50kV without any vacuum pump. The developed miniature X-ray tube was applied for intraoral dental radiography that employs an intra-oral CNT-based miniature X-ray tube and extra-oral X-ray detectors. An X-ray image of many teeth was successfully obtained by a single X-ray shot using the intra-oral miniature X-ray tube system. Furthermore, images of both molar teeth of pig were simultaneously obtained by a single X-ray shot. These results show that the intraoral dental radiography, which employs an intraoral miniature X-ray tube and an extraoral X-ray detector, performs better than conventional dental radiography.

  2. An intraoral miniature x-ray tube based on carbon nanotubes for dental radiography

    Energy Technology Data Exchange (ETDEWEB)

    Kim, Hyun Jin; Kim, Hyun Nam; Raza, Hamid Saeed; Park, Han Beom; Cho, Sung Oh [Dept. of Nuclear and Quantum Engineering, Korea Advanced Institute of Science and Technology, Daejeon (Korea, Republic of)

    2016-06-15

    A miniature X-ray tube based on a carbon-nanotube electron emitter has been employed for the application to a dental radiography. The miniature X-ray tube has an outer diameter of 7 mm and a length of 47 mm. The miniature X-ray tube is operated in a negative high-voltage mode in which the X-ray target is electrically grounded. In addition, X-rays are generated only to the teeth directions using a collimator while X-rays generated to other directions are shielded. Hence, the X-ray tube can be safely inserted into a human mouth. Using the intra-oral X-ray tube, a dental radiography is demonstrated where the positions of an X-ray source and a sensor are reversed compared with a conventional dental radiography system. X-ray images of five neighboring teeth are obtained and, furthermore, both left and right molar images are achieved by a single X-ray shot of the miniature X-ray tube.

  3. The Algorithm of Image Edge Detection on Panoramic Dental X-Ray using Multiple Morphological Gradient (mMG Method

    Directory of Open Access Journals (Sweden)

    Jufriadif Na`am

    2016-12-01

    Full Text Available Dental caries are tooth decay caused by bacterial infections . It is commonly known as cavities. This infection causes demineralization and hence destruction of the hard tissues of the teeth. Diagnosis of dental caries is conventionally carried out with the help of radiographic films. This research aims to develop some algorithm of the mMG method in identifying dental caries based using digital panoramic dental x-ray images. This paper presents an algorithm of using digital panoramic dental x-ray images to detect dental caries.  Type of algorithm used in this study is normal mMG, Enhancement mMG, and Smooth mMG.  This study makes use of MATLAB and it performs dental caries detection in three algorithms. A dataset of 225 digital panoramic dental x-ray images  in .png format is used to edge detection of the object in dental. The results are helpful to identify such caries from the tooth.

  4. Simulating X-ray diffraction of textured films

    DEFF Research Database (Denmark)

    Breiby, Dag W.; Bunk, Oliver; Andreasen, Jens Wenzel

    2008-01-01

    Computationally efficient simulations of grazing-incidence X-ray diffraction (GIXD) are discussed, with particular attention given to textured thin polycrystalline films on supporting substrates. A computer program has been developed for simulating scattering from thin films exhibiting varying...... from the totally substrate-reflected beam ( two-beam approximation) and refraction effects are also included in the program, together with the geometrical intensity corrections associated with GIXD measurements. To achieve 'user friendliness' for scientists less familiar with diffraction......, the mathematically simplest possible descriptions are sought whenever feasible. The practical use of the program is demonstrated for a selected thin-film example, perylene, which is of relevance for organic electronics....

  5. X-ray detection with GaN thin films

    Energy Technology Data Exchange (ETDEWEB)

    Hofstetter, Markus; Schmid, Martin; Thalhammer, Stefan [Helmholtz Zentrum Muenchen, Institute for Radiation Protection, Ingolstaedter Landstrasse 1, D-85764 Neuherberg (Germany); Howgate, John; Stutzmann, Martin [Walter Schottky Institut, Technische Universitaet Muenchen, Am Coulombwall 3, D-85748 Garching (Germany)

    2013-07-01

    In recent years precise miniature-dosimeters for real-time detection of X-rays in medicine have been developed with two aspects to monitor radiation in the region of interest and to improve therapeutic methods. Sensors include Germanium or Silicon photoconductive detectors, MOSFETs, and PIN-diodes. While miniaturization of these systems for spatial resolved detection is possible, they suffer from disadvantages. Sensor properties like material degradation, poor measurement stability and a limited detection range circumvent routine clinical applications. Here we show the development and evaluation of radiation detectors based on gallium nitride (GaN) thin films. While previous publications revealed relative low energy absorption of GaN, it is possible to achieve very high signal amplification factors inside the material due to an appropriate sensor configuration, which, in turn, compensates the low energy absorption. Our devices, which have detection volumes smaller than 10{sup (}-6) cm{sup 3}, show a high sensitivity to X-ray intensity and can record the air kerma rate (free-in-air) range of 1 microgray/s to 10 mGy/s with a signal stability of 1% and a linear total dose response over time. The presented results show the potential of GaN-based thin films for dosimetry and imaging applications.

  6. Dental x-rays and the risk of thyroid cancer: A case-control study

    Energy Technology Data Exchange (ETDEWEB)

    Memon, Anjum (Div. of Primary Care and Public Health, Brighton and Sussex Medical School (United Kingdom)), E-mail: a.memon@bsms.ac.uk; Godward, Sara (Dept. of Public Health and Primary Care, Univ. of Cambridge (United Kingdom)); Williams, Dillwyn (Thyroid Carcinogenesis Research Group, Strangeways Research Laboratories, Univ. of Cambridge (United Kingdom)); Siddique, Iqbal (Dept. of Medicine, Faculty of Medicine, Kuwait Univ. (Kuwait)); Al-Saleh, Khalid (Kuwait Cancer Control Centre, Ministry of Health (Kuwait))

    2010-05-15

    The thyroid gland is highly susceptible to radiation carcinogenesis and exposure to high-dose ionising radiation is the only established cause of thyroid cancer. Dental radiography, a common source of low-dose diagnostic radiation exposure in the general population, is often overlooked as a radiation hazard to the gland and may be associated with the risk of thyroid cancer. An increased risk of thyroid cancer has been reported in dentists, dental assistants, and x-ray workers; and exposure to dental x-rays has been associated with an increased risk of meningiomas and salivary tumours. Methods. To examine whether exposure to dental x-rays was associated with the risk of thyroid cancer, we conducted a population-based case-control interview study among 313 patients with thyroid cancer and a similar number of individually matched (year of birth +- three years, gender, nationality, district of residence) control subjects in Kuwait. Results. Conditional logistic regression analysis, adjusted for other upper-body x-rays, showed that exposure to dental x-rays was significantly associated with an increased risk of thyroid cancer (odds ratio = 2.1, 95% confidence interval: 1.4, 3.1) (p=0.001) with a dose-response pattern (p for trend <0.0001). The association did not vary appreciably by age, gender, nationality, level of education, or parity. Discussion. These findings, based on self-report by cases/controls, provide some support to the hypothesis that exposure to dental x-rays, particularly multiple exposures, may be associated with an increased risk of thyroid cancer; and warrant further study in settings where historical dental x-ray records may be available.

  7. Preventing bacterial growth on implanted device with an interfacial metallic film and penetrating X-rays.

    Science.gov (United States)

    An, Jincui; Sun, An; Qiao, Yong; Zhang, Peipei; Su, Ming

    2015-02-01

    Device-related infections have been a big problem for a long time. This paper describes a new method to inhibit bacterial growth on implanted device with tissue-penetrating X-ray radiation, where a thin metallic film deposited on the device is used as a radio-sensitizing film for bacterial inhibition. At a given dose of X-ray, the bacterial viability decreases as the thickness of metal film (bismuth) increases. The bacterial viability decreases with X-ray dose increases. At X-ray dose of 2.5 Gy, 98% of bacteria on 10 nm thick bismuth film are killed; while it is only 25% of bacteria are killed on the bare petri dish. The same dose of X-ray kills 8% fibroblast cells that are within a short distance from bismuth film (4 mm). These results suggest that penetrating X-rays can kill bacteria on bismuth thin film deposited on surface of implant device efficiently.

  8. Radiation-induced thumbs carcinoma due to practicing dental X-ray

    Directory of Open Access Journals (Sweden)

    Esam S Halboub

    2015-01-01

    Full Text Available Dealing with diagnostic X-ray radiation may result in serious health problems, unless protection guidelines are followed. This became prevalent immediately a decade following the invention of X-ray radiation, where it had not been known that the accumulative exposure to X-ray radiation may carry huge health hazards. The reoccurrence of various fatal cancer cases compelled the concerned health authorities to develop safety standards to be followed by all X-ray clinics and technicians worldwide. This report documents the clinical case of a dental radiographer, who developed thumbs carcinoma after 15 years of practicing the profession, most likely due to his neglect of the X-ray radiation protection guidelines.

  9. X-ray diffractometer configurations for thin film analysis

    Energy Technology Data Exchange (ETDEWEB)

    Haase, A. [Rich. Seifert and Co., Analytical X-ray Systems, Ahrensburg (Germany)

    1996-09-01

    A presentation of various configurations of focusing Seemann-Bohlin diffractometer, parafocusing Bragg-Brentano diffractometer and parallel beam are demonstrated. Equipped with different thin film attachments a comparison to conventional measurements are given. The application of different detector types like scintillation, gas proportional, electroluminescence (LUX) and solid state are described. Typical instrument set-ups for reflectometry, grazing incidence diffraction, total reflection, high resolution X-ray diffraction are explained. Different elements like slits, soller slits, pinhole collimators, crystal monochromators, monofiber (FOX) and polycapillaries (multifiber lens, Kumakhov lens`), flat or curved multilayer with constant or variable d-spacing, and their combinations are presented. The comparison of different beam conditioners in peak-to-background ratios are given. Wavelength dispersive scans show the energy discrimination possibilities of different beam optics.

  10. Cephalometric landmark detection in dental x-ray images using convolutional neural networks

    Science.gov (United States)

    Lee, Hansang; Park, Minseok; Kim, Junmo

    2017-03-01

    In dental X-ray images, an accurate detection of cephalometric landmarks plays an important role in clinical diagnosis, treatment and surgical decisions for dental problems. In this work, we propose an end-to-end deep learning system for cephalometric landmark detection in dental X-ray images, using convolutional neural networks (CNN). For detecting 19 cephalometric landmarks in dental X-ray images, we develop a detection system using CNN-based coordinate-wise regression systems. By viewing x- and y-coordinates of all landmarks as 38 independent variables, multiple CNN-based regression systems are constructed to predict the coordinate variables from input X-ray images. First, each coordinate variable is normalized by the length of either height or width of an image. For each normalized coordinate variable, a CNN-based regression system is trained on training images and corresponding coordinate variable, which is a variable to be regressed. We train 38 regression systems with the same CNN structure on coordinate variables, respectively. Finally, we compute 38 coordinate variables with these trained systems from unseen images and extract 19 landmarks by pairing the regressed coordinates. In experiments, the public database from the Grand Challenges in Dental X-ray Image Analysis in ISBI 2015 was used and the proposed system showed promising performance by successfully locating the cephalometric landmarks within considerable margins from the ground truths.

  11. Cross-sectional imaging with rotational panoramic X-ray machine for preoperative assessment of dental implant site. Comparisons of imaging properties with conventional film tomography and computed tomography

    Energy Technology Data Exchange (ETDEWEB)

    Makihara, Masahiro; Nishikawa, Keiichi; Kuroyanagi, Kinya [Tokyo Dental Coll., Chiba (Japan)

    2001-12-01

    To clarify the validity of cross-sectional imaging with rotational panoramic x-ray machine for preoperative assessment of the dental implant site, the imaging properties were compared with those of spiral tomography and multi-planer reconstruction (MPR) manipulation of x-ray computed tomography. Cross-sectional imaging of the maxilla and mandible of an edentulous dry skull was performed by each technique at an image layer thickness of 1 mm. Steel spheres were used to identify cross-sectional planes and measure distance. Six oral radiologists scored the image clarity of structures with 5-grade rating scales and measured the distance between images of 2 steel spheres. Each measured distance was divided by the magnification factor. The actual distance was also measured on the skull. The score and the distance were statistically compared. The Spearman's rank correlation coefficients for the score and the absolute values of the difference in distances measured by different observers were calculated as test units to compare inter-observer agreements statistically. The same observation and measurement were repeated to compare intra-observer agreement. Image clarity of the linear tomography available with a panoramic machine was comparable to spiral tomography and superior to MPR, except for the cortical bone on the lingual side. The inter- and intra-observer agreements were comparable. The accuracy for measurement of distance, the inter- and intra-observer agreements were also comparable to the spiral tomography and superior to those of MPR. Therefore, it is concluded that cross-sectional imaging with a rotational panoramic x-ray machine is useful for preoperative assessment of the dental implant site. (author)

  12. The reduction methods of operator's radiation dose for portable dental X-ray machines.

    Science.gov (United States)

    Cho, Jeong-Yeon; Han, Won-Jeong

    2012-08-01

    This study was aimed to investigate the methods to reduce operator's radiation dose when taking intraoral radiographs with portable dental X-ray machines. Two kinds of portable dental X-ray machines (DX3000, Dexcowin and Rextar, Posdion) were used. Operator's radiation dose was measured with an 1,800 cc ionization chamber (RadCal Corp.) at the hand level of X-ray tubehead and at the operator's chest and waist levels with and without the backscatter shield. The operator's radiation dose at the hand level was measured with and without lead gloves and with long and short cones. The backscatter shield reduced operator's radiation dose at the hand level of X-ray tubehead to 23 - 32%, the lead gloves to 26 - 31%, and long cone to 48 - 52%. And the backscatter shield reduced operator's radiation dose at the operator's chest and waist levels to 0.1 - 37%. When portable dental X-ray systems are used, it is recommended to select X-ray machine attached with a backscatter shield and a long cone and to wear the lead gloves.

  13. The reduction methods of operator's radiation dose for portable dental X-ray machines

    Directory of Open Access Journals (Sweden)

    Jeong-Yeon Cho

    2012-08-01

    Full Text Available Objectives This study was aimed to investigate the methods to reduce operator's radiation dose when taking intraoral radiographs with portable dental X-ray machines. Materials and Methods Two kinds of portable dental X-ray machines (DX3000, Dexcowin and Rextar, Posdion were used. Operator's radiation dose was measured with an 1,800 cc ionization chamber (RadCal Corp. at the hand level of X-ray tubehead and at the operator's chest and waist levels with and without the backscatter shield. The operator's radiation dose at the hand level was measured with and without lead gloves and with long and short cones. Results The backscatter shield reduced operator's radiation dose at the hand level of X-ray tubehead to 23 - 32%, the lead gloves to 26 - 31%, and long cone to 48 - 52%. And the backscatter shield reduced operator's radiation dose at the operator's chest and waist levels to 0.1 - 37%. Conclusions When portable dental X-ray systems are used, it is recommended to select X-ray machine attached with a backscatter shield and a long cone and to wear the lead gloves.

  14. The use of CdTe detectors for dental X-ray spectrometry

    Energy Technology Data Exchange (ETDEWEB)

    Santos, Marcus Aurelio P. dos; Fragoso, Maria da Conceicao F.; Oliveira, Mercia L.; Lima, Ricardo de A.; Hazin, Clovis A. [Centro Regional de Ciencias Nucleares (CRCN/CNEN-PE), Recife, PE (Brazil)]. E-mails: masantos@cnen.gov.br; mariacc05@yahoo.com.br; mercial@cnen.gov.br; ralima@cnen.gov.br; chazin@cnen.gov.br

    2007-07-01

    he cadmium telluride (CdTe) semiconductor detector provides high detection efficiency for use in the diagnostic x-rays energy range, because of the high atomic number and high density of the crystal. Moreover, it has the great advantage of working at room temperature, in contrast to the germanium detector, which operates in liquid nitrogen temperature. The CdTe detector has been utilized in diagnostic x-ray spectroscopy, but only scarce information about its use in dental X-ray beams has been published. In this way, a portable 3x3x1 mm{sup 3} CdTe solid state detector (XR-100T CdTe by Amptek, Inc.) with tungsten pinhole collimators, alignment device and associated software was utilized in this work for measuring the photon spectra in the dental x-ray kVp range. A single-phase dental unit with adjustable kVp and mA was employed and the x-ray spectra were experimentally determined at 50, 60 and 70 kVp with 0.5 mA tube current. The pulse height distribution obtained with this detector, however, does not represent the 'true' photon spectra. For this reason, a stripping procedure was implemented to correct the distribution in order to determine the real photon spectra. The x-ray spectra obtained with the CdTe detector were compared with the ones measured with a high-purity germanium detector (EGP200-13-TR by Eurisys Mesures). The reasonable agreement between the results obtained with both detectors for the 50 to 70 keV range show that CdTe detectors can be utilized for dental x-ray spectrometry. (author)

  15. Evaluating Superconducting YBCO Film Properties Using X-Ray Photoelectron Spectroscopy (Postprint)

    Science.gov (United States)

    2012-02-01

    AFRL-RZ-WP-TP-2012-0093 EVALUATING SUPERCONDUCTING YBCO FILM PROPERTIES USING X-RAY PHOTOELECTRON SPECTROSCOPY (POSTPRINT) Paul N. Barnes...2012 Conference Paper Postprint 01 January 2002 – 01 January 2004 4. TITLE AND SUBTITLE EVALUATING SUPERCONDUCTING YBCO FILM PROPERTIES USING X-RAY

  16. X-ray study of chromium oxide films epitaxially grown on MgO

    NARCIS (Netherlands)

    Du, XS; Hak, S; Rogojami, OC; Hibma, T

    2004-01-01

    Chromium oxide films grown by molecular beam epitaxy on MgO (001) substrates were characterized by x-ray diffraction (XRD) and x-ray reflectivity (XRR) measurements. The absence of random oriented peaks in the theta-2theta spectra indicated that the thin films were a single phase. Reciprocal space

  17. Pyroelectric composite film for X-ray intensity detection

    Directory of Open Access Journals (Sweden)

    Walter Katsumi Sakamoto

    2012-04-01

    Full Text Available Composite material obtained with modified lead titanate (Pz34 ferroelectric ceramic and polyether-ether-ketone (PEEK polymer matrix was used as sensitive component to measure X-ray intensity in a novel detection system. The sensing element works as a thermal transducer, converting a non-quantified thermal flux into an output measurable quantity of electrical voltage. The samples were obtained up to 60 vol.% of ceramic, by hot pressing the mixture of Pz34 and PEEK powders at 368 °C and applying 12 MPa pressure for 2.0 hours. The sensor response varies from 2.70 to 0.80 V in the energy fluence rate range of 6.30 to 37.20 W.m-2. The absorbed incident energy was analyzed as a function of the ionizing energy. Furthermore, by measuring the pyroelectric activity of the composite film it was observed that there is no degradation of the sensor after the irradiation.

  18. Radiation exposure to foetus and breasts from dental X-ray examinations: effect of lead shields

    National Research Council Canada - National Science Library

    Kelaranta, Anna; Ekholm, Marja; Toroi, Paula; Kortesniemi, Mika

    2016-01-01

    .... In such cases, the radiation dose to the foetus, though low, needs to be estimated. Uniform and widely used guidance on dental X-ray procedures during pregnancy are presently lacking, the usefulness of lead shields is unclear and practices vary...

  19. X-ray micro diffraction study on mesostructured silica thin films

    CERN Document Server

    Noma, T; Miyata, H; Iida, A

    2001-01-01

    The local structure of highly ordered mesostructured silica films was investigated by using a synchrotron X-ray microbeam and a CCD X-ray detector. Two-dimensional X-ray diffraction patterns clearly showed the detailed arrangement of the mesostructures, in which the hexagonal mesochannels aligned uniaxially in the mesostructured silica films formed on a silica glass substrate with a rubbing-treated thin polyimide coating. The alignment direction was shown to be perpendicular to the rubbing direction. The grazing incidence condition revealed the structural anisotropy of the mesostructures, while normal incidence X-ray diffraction data indicated the in-plane structural uniformity of the films. Extra spots were observed in the diffraction patterns. This suggested that the X-ray beam reflected at the boundary of the mesostructured silica film and the substrate.

  20. X-ray measurements of the depth dependence of stress in gold films

    Energy Technology Data Exchange (ETDEWEB)

    Brennan, S.; Munkholm, A.; Leung, O. S.; Nix, W. D.

    2000-01-12

    X-rays are used to determine the stress as a function of depth for five evaporated gold films of 0.8--2.5 microns thickness. The depth dependence is achieved by varying the incident angle of the x-rays, which effects the penetration depth of the x-rays into the film. The films, which have a different thermal expansion coefficient than the silicon substrate, are strained as a result of thermal cycling after deposition. The authors find essentially no variation with stress as a function of depth for these films.

  1. Thin film characterisation by advanced X-ray diffraction techniques

    Energy Technology Data Exchange (ETDEWEB)

    Cappuccio, G.; Terranova, M.L. [eds.] [INFN, Laboratori Nazionali di Frascati, Rome (Italy)

    1996-09-01

    This report described the papers presented at the 5. School on X-ray diffraction from polycrystalline materials held at Frascati (Rome) in 2-5 October 1996. A separate abstract was prepared for each of the papers.

  2. Composition variations in Cu{sub 2}ZnSnSe{sub 4} thin films analyzed by X-ray diffraction, energy dispersive X-ray spectroscopy, particle induced X-ray emission, photoluminescence, and Raman spectroscopy

    Energy Technology Data Exchange (ETDEWEB)

    Nam, Dahyun [Department of Physics, Sogang University, Seoul 121-742 (Korea, Republic of); Opanasyuk, A.S.; Koval, P.V.; Ponomarev, A.G. [Department of Electronics and Computer Technology, Sumy State University, Sumy UA-40007 (Ukraine); Jeong, Ah Reum; Kim, Gee Yeong; Jo, William [Department of Physics, Ewha Womans University, Seoul 120-750 (Korea, Republic of); Cheong, Hyeonsik, E-mail: hcheong@sogang.ac.kr [Department of Physics, Sogang University, Seoul 121-742 (Korea, Republic of)

    2014-07-01

    Compositional and structural studies of Cu{sub 2}ZnSnSe{sub 4} (CZTSe) thin films were carried out by X-ray diffraction, energy dispersive X-ray spectroscopy (EDS), particle induced X-ray emission (PIXE), photoluminescence, and Raman spectroscopy. CZTSe thin films with different compositions were deposited on sodalime glass by co-evaporation. The composition of the films measured by two different methods, EDS and PIXE, showed significant differences. Generally, the Zn/Sn ratio measured by EDS is larger than that measured by PIXE. Both the micro-PIXE and the micro-Raman imaging results indicated the compositional and structural inhomogeneity of the sample. - Highlights: • Particle induced X-ray emission was used to analyze the composition of CZTSe films. • Energy dispersive X-ray spectroscopy tends to underestimate the Sn composition. • Local Raman intensity is related with the composition rather than the crystallinity.

  3. Frequency of medical and dental x-ray examinations in the UK. 1997/98

    Energy Technology Data Exchange (ETDEWEB)

    Tanner, R.; Wall, B.; Shrimpton, P. [and others

    2000-12-01

    A survey has been performed to assess the numbers of all types of radiological x-ray examination conducted in the UK during the period from April 1997 to March 1998. The survey covers all diagnostic and interventional procedures using x-rays for medical and dental purposes, both within and outside the National Health Service (NHS), but excludes a detailed analysis of magnetic resonance imaging (MRI), ultrasound and nuclear medicine. This is the first such national survey conducted by NRPB since 1983. The results provide a current picture of the pattern of medical x-ray imaging practice in the UK and will allow revised estimates to be made of the collective dose to the population from these procedures. The survey has utilised detailed information available from radiology management systems at a selected sample of 38 English NHS trusts. The different classifications of x-ray procedure have been re-arranged into 62 standardised categories based on anatomical location and whether they were conventional, computed tomography (CT) or interventional procedures. Extrapolation of the sample data to the whole of England was carried out using broad NHS radiology statistics (KH12 returns) for the period of the survey from the Department of Health. Additional data have been obtained covering NHS radiology practice in Wales and Northern Ireland and also for x-ray imaging practice outside NHS hospitals such as that performed in independent hospitals and by dentists and chiropractors. Results are presented giving the annual numbers and relative frequencies of x-ray examinations in the 62 categories and the contributions from radiology practice outside NHS hospitals and from the whole of the UK. Altogether, about 41.5 million medical and dental x-ray examinations were conducted in the UK in 1997/98, corresponding to 704 examinations per 1000 inhabitants. The increase since 1983 for medical examinations conducted in NHS hospitals has just kept pace with the increase in population

  4. Filming Femtosecond Molecular Movies with X-ray Pulses

    DEFF Research Database (Denmark)

    Kjær, Kasper Skov

    This thesis describes the investigation of time-resolved phenomena using X-ray techniques, and in particular the new possibilities and challenges arising from the application of these techniques on the femtosecond time-scale. The thesis will review the processes following laser excitation...... of molecular species in solution, describing the interplay between electronic and structural dynamics, as well as the role of the solvent. This will be followed by an introduction of the three X-ray techniques used in this work, and it will be shown how the application of these techniques in a laser pump / X...... yielded by (and the practical challenges connected to) their simultaneous implementation in a single experiment. Finally, the experimental results of a signicant set of laser pump / X-ray probe experiments will be presented and discussed in order to gauge the applicability of these techniques as tools...

  5. Molecular orientation in soft matter thin films studied by resonant soft X-ray reflectivity

    Energy Technology Data Exchange (ETDEWEB)

    Mezger, Markus; Jerome, Blandine; Kortright, Jeffrey B.; Valvidares, Manuel; Gullikson, Eric; Giglia, Angelo; Mahne, Nicola; Nannarone, Stefano

    2011-01-12

    We present a technique to study depth profiles of molecular orientation in soft matter thin films with nanometer resolution. The method is based on dichroism in resonant soft X-ray reflectivity using linear s- and p-polarization. It combines the chemical sensitivity of Near-Edge X-ray Absorption Fine Structure spectroscopy to specific molecular bonds and their orientation relative to the polarization of the incident beam with the precise depth profiling capability of X-ray reflectivity. We demonstrate these capabilities on side chain liquid crystalline polymer thin films with soft X-ray reflectivity data at the carbon K edge. Optical constants of the anisotropic refractive index ellipsoid were obtained from a quantitative analysis using the Berreman formalism. For films up to 50 nm thickness we find that the degree of orientation of the long axis exhibits no depth variation and isindependent of the film thickness.

  6. Probing the polarity of ferroelectric thin films with x-ray standing waves

    Energy Technology Data Exchange (ETDEWEB)

    Bedzyk, M. J. [Department of Materials Science and Engineering and Materials Research Center, Northwestern University, Evanston, Illinois 60208 (United States); Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States); Kazimirov, A. [Department of Materials Science and Engineering and Materials Research Center, Northwestern University, Evanston, Illinois 60208 (United States); Marasco, D. L. [Department of Materials Science and Engineering and Materials Research Center, Northwestern University, Evanston, Illinois 60208 (United States); Lee, T.-L. [Department of Materials Science and Engineering and Materials Research Center, Northwestern University, Evanston, Illinois 60208 (United States); Foster, C. M. [Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States); Advanced Micro Devices, 5204 East Ben White Boulevard, Austin, Texas 78741 (United States); Bai, G.-R. [Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States); Lyman, P. F. [Department of Materials Science and Engineering and Materials Research Center, Northwestern University, Evanston, Illinois 60208 (United States); Keane, D. T. [Department of Materials Science and Engineering and Materials Research Center, Northwestern University, Evanston, Illinois 60208 (United States)

    2000-03-15

    An x-ray-diffraction method that directly senses the phase of the structure factor is demonstrated and used for determining the local polarity of thin ferroelectric films. This method is based on the excitation of an x-ray standing-wave field inside the film as a result of the interference between the strong incident x-ray wave and the weak kinematically Bragg-diffracted x-ray wave from the film. The method is used to sense the displacements of the Pb and Ti sublattices in single-crystal c-domain PbTiO{sub 3} thin films grown by metal-organic chemical-vapor deposition on SrTiO{sub 3}(001) substrates. (c) 2000 The American Physical Society.

  7. Association of brain cancer with dental x-rays and occupation in Missouri

    Energy Technology Data Exchange (ETDEWEB)

    Neuberger, J.S.; Brownson, R.C.; Morantz, R.A.; Chin, T.D. (Department of Preventive Medicine, University of Kansas Medical School, Kansas City (USA))

    1991-01-01

    This investigation of a brain cancer cluster in Missouri used two approaches to investigate associations with potential risk factors. In a case-control study in a rural town, we interviewed surrogates of cases and controls about potential risk factors. We found a statistically significant positive association of brain cancer with reported exposure to dental x-rays. Occupation was not associated with the cluster in the rural town. In a standardized proportional mortality study for the state of Missouri, we calculated the observed and expected proportion of brain cancers by occupation and industry in Missouri decedents. We found that motor vehicle manufacturers, beauty shop workers, managers and administrators, elementary school teachers, and hairdressers and cosmetologists had significantly elevated proportions of brain cancer. Brain tumors are inconsistently associated with occupation in the literature. Further study of brain cancer etiology with respect to dental x-ray exposures seems warranted.

  8. Structural characterization of lead sulfide thin films by means of X-ray line profile analysis

    Indian Academy of Sciences (India)

    N Choudhury; B K Sarma

    2009-02-01

    X-ray diffraction patterns of chemically deposited lead sulphide thin films have been recorded and X-ray line profile analysis studies have been carried out. The lattice parameter, crystallite size, average internal stress and microstrain in the film are calculated and correlated with molarities of the solutions. Both size and strain are found to contribute towards the broadening of X-ray diffraction line. The values of the crystallite size are found to be within the range from 22–33 nm and the values of strain to be within the range from 1.0 × 10-3–2.5 × 10-3.

  9. Thickness measurement of organic films using Compton scattering of characteristic X-rays

    Energy Technology Data Exchange (ETDEWEB)

    Kim, Jong-Yun, E-mail: kjy@kaeri.re.kr [Nuclear Chemistry Research Division, Korea Atomic Energy Research Institute, Daedeok-daero 1045, Dukjin-dong Yuseong-gu, Daejeon 305-353 (Korea, Republic of); Choi, Yong Suk; Park, Yong Joon; Song, Kyuseok [Nuclear Chemistry Research Division, Korea Atomic Energy Research Institute, Daedeok-daero 1045, Dukjin-dong Yuseong-gu, Daejeon 305-353 (Korea, Republic of); Jung, Sung-Hee [Division of Radioisotope R and D, Korea Atomic Energy Research Institute, Daedeok-daero 1045, Dukjin-dong Yuseong-gu, Daejeon 305-353 (Korea, Republic of); Hussein, Esam M.A. [Laboratory for Threat Materials Detection, Department of Mechanical Engineering, University of New Brunswick, Fredericton, New Brunswick, Canada E3B 5A3 (Canada)

    2011-09-15

    An X-ray scattering method is presented for determining the thickness of an organic film placed on a steel substrate. The strong peaks of characteristic X-rays are taken as an advantage to measure the intensity of backscattered photons. It is shown that the intensity of Compton scattering of characteristic X-rays is proportional to film thickness, up to the thickness of 250 {mu}m of acrylic adhesive layers. In addition, the measurement time was 300 ms, providing a simple and convenient method for on-line for thickness monitoring.

  10. X-ray diffractometer stage for in situ structural analysis of thin films

    Science.gov (United States)

    Johnson, R. W.; Johnson, W. L.

    1988-12-01

    A theta-two theta x-ray diffractometer stage has been developed for in situ structural characterization of thin-film samples. This stage integrates an ultrahigh vacuum dc ion-beam thin-film sample preparation chamber with the Siemens D500 x-ray diffractometer. In vacuo sample translation and manipulation is provided. The stage incorporates resistive heating to 900 K and liquid nitrogen cooling to 150 K. The sample theta rotation is transmitted into the vacuum chamber by a rotary feedthrough. X rays enter the vacuum chamber through a beryllium window with allowed reflection angles from 0 to +168° two-theta.

  11. Development of object simulator for radiation field of dental x-rays

    OpenAIRE

    Silva,L.F.; Ferreira,F.C.L.; Sousa, E. F.; Cardoso, Leandro Xavier; Vasconcelos, E. D. S.; Brasil, Lourdes Mattos

    2013-01-01

    In dentistry radiography is of fundamental importance to the dentist can make an accurate diagnosis. For this it is necessary to pay attention to the radiological protection of both the professional and the patient and control image quality for an accurate diagnosis. In this work, quality control tests were performed on X-ray machines in private dental intraoral in the municipality of Marabá, where they measured the diameters of the radiation field to see if these machines are ...

  12. X-ray crystallography

    Science.gov (United States)

    2001-01-01

    X-rays diffracted from a well-ordered protein crystal create sharp patterns of scattered light on film. A computer can use these patterns to generate a model of a protein molecule. To analyze the selected crystal, an X-ray crystallographer shines X-rays through the crystal. Unlike a single dental X-ray, which produces a shadow image of a tooth, these X-rays have to be taken many times from different angles to produce a pattern from the scattered light, a map of the intensity of the X-rays after they diffract through the crystal. The X-rays bounce off the electron clouds that form the outer structure of each atom. A flawed crystal will yield a blurry pattern; a well-ordered protein crystal yields a series of sharp diffraction patterns. From these patterns, researchers build an electron density map. With powerful computers and a lot of calculations, scientists can use the electron density patterns to determine the structure of the protein and make a computer-generated model of the structure. The models let researchers improve their understanding of how the protein functions. They also allow scientists to look for receptor sites and active areas that control a protein's function and role in the progress of diseases. From there, pharmaceutical researchers can design molecules that fit the active site, much like a key and lock, so that the protein is locked without affecting the rest of the body. This is called structure-based drug design.

  13. Hard X-rays for processing hybrid organic-inorganic thick films.

    Science.gov (United States)

    Jiang, Yu; Carboni, Davide; Pinna, Alessandra; Marmiroli, Benedetta; Malfatti, Luca; Innocenzi, Plinio

    2016-01-01

    Hard X-rays, deriving from a synchrotron light source, have been used as an effective tool for processing hybrid organic-inorganic films and thick coatings up to several micrometres. These coatings could be directly modified, in terms of composition and properties, by controlled exposure to X-rays. The physico-chemical properties of the coatings, such as hardness, refractive index and fluorescence, can be properly tuned using the interaction of hard X-rays with the sol-gel hybrid films. The changes in the microstructure have been correlated especially with the modification of the optical and the mechanical properties. A relationship between the degradation rate of the organic groups and the rise of fluorescence from the hybrid material has been observed; nanoindentation analysis of the coatings as a function of the X-ray doses has shown a not linear dependence between thickness and film hardness.

  14. Application of digital tomosynthesis (DTS) of optimal deblurring filters for dental X-ray imaging

    Energy Technology Data Exchange (ETDEWEB)

    Oh, J. E.; Cho, H. S.; Kim, D. S.; Choi, S. I.; Je, U. K. [Yonsei University, Wonju (Korea, Republic of)

    2012-04-15

    Digital tomosynthesis (DTS) is a limited-angle tomographic technique that provides some of the tomographic benefits of computed tomography (CT) but at reduced dose and cost. Thus, the potential for application of DTS to dental X-ray imaging seems promising. As a continuation of our dental radiography R and D, we developed an effective DTS reconstruction algorithm and implemented it in conjunction with a commercial dental CT system for potential use in dental implant placement. The reconstruction algorithm employed a backprojection filtering (BPF) method based upon optimal deblurring filters to suppress effectively both the blur artifacts originating from the out-focus planes and the high-frequency noise. To verify the usefulness of the reconstruction algorithm, we performed systematic simulation works and evaluated the image characteristics. We also performed experimental works in which DTS images of enhanced anatomical resolution were successfully obtained by using the algorithm and were promising to our ongoing applications to dental X-ray imaging. In this paper, our approach to the development of the DTS reconstruction algorithm and the results are described in detail.

  15. Evaluation of X-ray microanalysis for characterization of dental enamel.

    Science.gov (United States)

    Melin, Lisa; Norén, Jörgen G; Taube, Fabian; Cornell, David H

    2014-02-01

    Elemental analysis of dental hard tissues is of importance. The aim of this study is to evaluate X-ray microanalysis (XRMA) of bovine enamel in a scanning electron microscope (SEM) with different coatings. The buccal surface of bovine incisors was polished flat, one-third was coated with carbon, one-third with gold, leaving one-third uncoated for XRMA in an SEM equipped with an energy-dispersive microanalysis system. The elements oxygen, sodium, magnesium, phosphorous, chlorine, potassium, and calcium were analyzed using their respective characteristic K X-ray series. Comparisons were made with analyses of glass produced by fusion of the bovine enamel, showing that oxygen analyses using the K X-ray series are reliable and preferable to calculating oxygen by stoichiometry for natural enamel. For the gold-coated and uncoated analyses, carbon was also measured using the K X-ray series. Small area Analyses in small areas (80 × 80 μm) in variable pressure-SEM mode with low vacuum (20 Pa), without any coating, midway between 40 μm wide gold lines 140 μm apart to avoid build-up of electrostatic charge is the preferred method, especially if carbon is included in the analysis. The analyses of bovine enamel are sufficiently reproducible to be regarded as quantitative for all elements except carbon.

  16. Synchrotron X-ray diffraction characterization of healthy and fluorotic human dental enamel

    Science.gov (United States)

    Colaço, M. V.; Barroso, R. C.; Porto, I. M.; Gerlach, R. F.; Costa, F. N.; Braz, D.; Droppa, R.; de Sousa, F. B.

    2012-10-01

    With the introduction of fluoride as the main anticaries agent used in preventive dentistry, and perhaps an increase in fluoride in our food chain, dental fluorosis has become an increasing world-wide problem. Visible signs of fluorosis begin to become obvious on the enamel surface as opacities, implying some porosity in the tissue. The mechanisms that conduct the formation of fluorotic enamel are unknown, but should involve modifications in the basic physical-chemistry reactions of demineralization and remineralisation of the enamel of the teeth, which is the same reaction of formation of the enamel's hydroxyapatite (HAp) in the maturation phase. The increase of the amount of fluoride inside of the apatite will result in gradual increase of the lattice parameters. The aim of this work is to characterize the healthy and fluorotic enamel in human tooth using Synchrotron X-ray diffraction. All the scattering profile measurements were carried out at the X-ray diffraction beamline (XRD1) at the Brazilian Synchrotron Light Laboratory—LNLS, Campinas, Brazil. X-ray diffraction experiments were performed both in powder samples and polished surfaces. The powder samples were analyzed to obtain the characterization of a typical healthy enamel pattern. The polished surfaces were analyzed in specific areas that have been identified as fluorotic ones. X-ray diffraction data were obtained for all samples and these data were compared with the control samples and also with the literature data.

  17. In-situ surface sensitive X-ray investigations of quench condensed thin metal films

    Energy Technology Data Exchange (ETDEWEB)

    Markert, Christian; Luetzenkirchen-Hecht, Dirk; Gertz, Sascha; Frahm, Ronald [Bergische Universitaet Wuppertal, Fachbereich C / Abteilung Physik, Gaussstrasse 20, 42119 Wuppertal (Germany)

    2007-07-01

    We report of ultrahigh vacuum (UHV) experiments on ultra thin Au, Bi and Pb films (thickness less than 10 nm) deposited on atomically flat float-glass substrates which are held at cryogenic temperatures down to 10 K. For deposition temperatures below 100 K the formation of highly disordered or even amorphous metal films can be expected, because thermally activated diffusion of the ad atoms should be inhibited. An UHV chamber was constructed which is suited for grazing incidence X-ray experiments during the quench condensation of the metal films. Various X-ray methods were used for the in-situ investigation of the films growth and their structural evolution with the thickness and an subsequent annealing process. EXAFS (Extended X-ray Absorption Fine Structure) in reflection is used to study the local structure of the films. Furthermore specular and non-specular X-ray reflectivity measurements were performed to get information about the films density and surface roughness parameters (correlation length, hurst parameter etc.). In addition in situ resistivity measurements which are sensitive towards changes of the films microstructure were performed in parallel to the X-ray experiments.

  18. Evaluation of the shielding of dental X-rays units; Evaluacion del blindaje de unidades de rayos X dentales

    Energy Technology Data Exchange (ETDEWEB)

    Medrano, E.; Vega C, H. R.; Letechipia de L, C.; Hernandez D, V. M.; Salas L, M. A., E-mail: edumeco@yahoo.com.mx [Universidad Autonoma de Zacatecas, Apdo. Postal 336, 98000 Zacatecas (Mexico)

    2014-08-15

    The capacity of the walls of the dental radio-diagnostic rooms has been determined, to diminish the dose levels during the use of the X-rays equipment s. The study was carried out in the Dentistry Academic Unit of the campus Siglo X XI of the Universidad Autonoma de Zacatecas. The X-rays equipment s are a learning tool for the dentistry students and they are also used for offering health services to the population; for this reason is important to verify that the dose levels outside of the room walls are safe. During the evaluation process were used conservative approaches without prejudice of the thickness necessary in benefit of the radiological protection. Of the evaluation was found that all the walls satisfy their function thoroughly like barriers against the X-rays. (Author)

  19. X-Ray Protection

    Science.gov (United States)

    1955-01-01

    15,000. • When developed In Kodak liquid X-ray developer for 5 min at a temperature of 200 C. b Film sensitivities vary with photon energy by the...for example temporomandibular -joint exposures where a skin dose of 25 r or more may be obtained during a single exposure with 65 kvp, 1.5 mm aluminum...communication. W. J. Updegrave, Temporomandibular articulation-X-ray examina- tion, Dental Radiography and Photography 26, No. 3, 41 (1953). H. 0. Wyckoff, R. J

  20. Stopping x-ray pulses in a thin-film cavity via electromagnetically induced transparency

    CERN Document Server

    Kong, Xiangjin

    2015-01-01

    Stopping light via an electromagnetically induced transparency setup for x-ray pulses in a thin film planar x-ray cavity is investigated theoretically. The pulse is nearly resonant to the 14.4 keV M\\"ossbauer transition in $^{57}\\mathrm{Fe}$, with one nm-thin layer of the latter embedded in the thin-film x-ray cavity. Via a moderate hyperfine magnetic field which takes over the role of the control field, electromagnetically induced transparency and slowing down of the x-ray pulse occurs in the cavity setup. We show that by switching off the control magnetic field, a narrowband x-ray pulse can be completely stored in the cavity for approx. hundred ns. Coherent storage occurs in this scenario by imprinting the x-ray field onto nuclear coherences in a controllable and robust manner. Additional manipulation of the external magnetic field can lead to both group velocity and phase control of the pulse in the x-ray cavity sample.

  1. Thin film growth studies using time-resolved x-ray scattering

    Science.gov (United States)

    Kowarik, Stefan

    2017-02-01

    Thin-film growth is important for novel functional materials and new generations of devices. The non-equilibrium growth physics involved is very challenging, because the energy landscape for atomic scale processes is determined by many parameters, such as the diffusion and Ehrlich-Schwoebel barriers. We review the in situ real-time techniques of x-ray diffraction (XRD), x-ray growth oscillations and diffuse x-ray scattering (GISAXS) for the determination of structure and morphology on length scales from Å to µm. We give examples of time resolved growth experiments mainly from molecular thin film growth, but also highlight growth of inorganic materials using molecular beam epitaxy (MBE) and electrochemical deposition from liquids. We discuss how scaling parameters of rate equation models and fundamental energy barriers in kinetic Monte Carlo methods can be determined from fits of the real-time x-ray data.

  2. Study of NbC thin films for soft X-ray multilayer applications

    Energy Technology Data Exchange (ETDEWEB)

    Singh, Amol, E-mail: amolphy@rrcat.gov.in, E-mail: rrcat.amol@gmail.com; Modi, Mohammed H.; Lodha, G. S. [Indus Synchrotrons Utilization Division, Raja Ramanna Centre for Advanced Technology, Indore-452013 (India); Rajput, Parasmani; Jha, S. N. [Atomic & Molecular Physics Division, Bhabha Atomic Research Centre, Trombay, Mumbai-400085 (India)

    2015-06-24

    Compound materials are being used in soft x-ray and Extreme ultraviolet (EUV) optics applications. Structural properties of compound materials changes drastically when ultrathin films are formed from bulk material. Structural properties need to be investigated to determine the suitability of compound materials in soft x-ray multilayer applications. In the present study Niobium carbide (NbC) thin films were deposited using ion beam sputtering of an NbC target on Si (100) substrate. Thickness roughness and film mass density was determined from the X-ray reflectivity (XRR) data. XRR data revealed that the film mass density was increasing with increase in film thickness. For 500Ǻ thick film, mass density of 6.85 g/cm{sup 3}, close to bulk density was found. Rms roughness for all the films was less than 10Å. Local structure of NbC thin films was determined from EXAFS measurements. The EXAFS data showed an increase in Nb-C and Nb-(C)-Nb peak ratio approaches towards bulk NbC with increasing thickness of NbC. From the present study, NbC thin films were found suitable for actual use in soft x-ray multilayer applications.

  3. Study of NbC thin films for soft X-ray multilayer applications

    Science.gov (United States)

    Singh, Amol; Modi, Mohammed. H.; Rajput, Parasmani; Jha, S. N.; Lodha, G. S.

    2015-06-01

    Compound materials are being used in soft x-ray and Extreme ultraviolet (EUV) optics applications. Structural properties of compound materials changes drastically when ultrathin films are formed from bulk material. Structural properties need to be investigated to determine the suitability of compound materials in soft x-ray multilayer applications. In the present study Niobium carbide (NbC) thin films were deposited using ion beam sputtering of an NbC target on Si (100) substrate. Thickness roughness and film mass density was determined from the X-ray reflectivity (XRR) data. XRR data revealed that the film mass density was increasing with increase in film thickness. For 500Å thick film, mass density of 6.85 g/cm3, close to bulk density was found. Rms roughness for all the films was less than 10Å. Local structure of NbC thin films was determined from EXAFS measurements. The EXAFS data showed an increase in Nb-C and Nb-(C)-Nb peak ratio approaches towards bulk NbC with increasing thickness of NbC. From the present study, NbC thin films were found suitable for actual use in soft x-ray multilayer applications.

  4. Thermal transport in thin films measured by time-resolved, grazing incidence x-ray diffraction.

    Energy Technology Data Exchange (ETDEWEB)

    Walko, D. A.; Sheu, Y.-M.; Trigo, M.; Reis, D. A. (X-Ray Science Division); (Univ. of Michigan,); (SLAC National Accelerator Lab.); (Stanford Univ.)

    2011-01-01

    We use depth- and time-resolved x-ray diffraction to study thermal transport across single crystal Bi films grown on sapphire in order to determine the thermal conductivity of the film and the Kapitza conductance of the interface. Ultrafast Ti:sapphire laser pulses were used to heat the films; x-ray diffraction then measured the film's lattice expansion. Use of grazing incidence diffraction geometry provided depth sensitivity, as the x-ray angle of incidence was varied near the critical angle. The shift of the film's Bragg peak position with time was used to determine the film temperature averaged over an x-ray penetration depth that could be selected by choice of the angle of incidence. For films that were thick compared to the laser penetration depth, we observed a large temperature gradient at early times. In this case, measurements with the incident angle near or well above the critical angle were more sensitive to the film conductivity or Kapitza conductance, respectively. For thinner films, however, cooling was dominated by the Kapitza conductance at all accessible time scales.

  5. Dental Training Films.

    Science.gov (United States)

    Veterans Administration Medical Center, Washington, DC.

    This dental training films catalog is organized into two sections. Section I is a category listing of the films by number and title, indexed according to generalized headings; categories are as follow: anatomy, articulator systems, complete dentures, dental assisting, dental laboratory technology, dental materials, dental office emergencies,…

  6. Application of X-rays to dental age estimation in medico-legal practice

    Directory of Open Access Journals (Sweden)

    Dorota Lorkiewicz-Muszyńska

    2015-05-01

    Full Text Available Aim of the study: The paper addresses the use of dental age assessment methods based on radiographs in medico-legal practice. Different cases of practical application of the methods are presented including identification of human remains, dental age assessment in a living person and one archaeological case. Material and methods : The study material consisted of cases involving dental age assessment performed in the Department of Forensic Medicine, Poznan University of Medical Sciences in Poznan. Depending on the preliminary assessment of age, the Liversidge or the Kvaal et al. methods were applied. Dental age was estimated on the basis of available pantomograms. In the case of the living person, it was a radiograph supplied for expert evaluation. In the other cases, dental computed tomography was performed. Results : Dental age was successfully estimated in all of the cases. Various methods based on the analysis of X-ray images were applied. Dental age was shown to be correlated with skeletal age. Conclusions : The methods based on radiographs were demonstrated to be useful, and the results they yield are fully correlated with results of anthropological analyses.

  7. Correlating properties and microstructure of YBCO thin films by magnetic X-ray microscopy

    Energy Technology Data Exchange (ETDEWEB)

    Ruoss, Stephen; Stahl, Claudia; Weigand, Markus; Schuetz, Gisela [Max-Planck-Institute for Intelligent Systems, Heisenbergstrasse 3, 70569 Stuttgart (Germany); Zahn, Patrick; Bayer, Jonas [Max-Planck-Institute for Intelligent Systems, Heisenbergstrasse 3, 70569 Stuttgart (Germany); Research Institute for Innovative Surfaces, FINO, Aalen University, Beethovenstrasse 1, 73430 Aalen (Germany); Albrecht, Joachim [Research Institute for Innovative Surfaces, FINO, Aalen University, Beethovenstrasse 1, 73430 Aalen (Germany)

    2016-07-01

    The magnetic flux distribution in high-temperature superconductors namely YBCO has been observed using a novel high-resolution technique based on the X-ray magnetic circular dichroism (XMCD). Therefore, a CoFeB layer is deposited on the superconductor which exhibits a strong XMCD-effect. X-ray absorption measurements with circular polarized radiation allows the analysis of the magnetic flux distribution in the superconductor via the soft-magnetic sensor layer [3,4]. In the total electron yield (TEY) mode of the scanning X-ray microscope (SXM) the surface structure and the magnetic domains can be imaged at the same time. Having obtained such high resolution images, the correlation of magnetic flux penetration and defect structure of YBCO thin films can be analyzed. The measurements have been performed at the scanning X-ray microscope MAXYMUS at Bessy II, HZB Berlin.

  8. Micro-imaging of buried layers and interfaces in ultrathin films by X-ray reflectivity

    Science.gov (United States)

    Jiang, Jinxing; Hirano, Keiichi; Sakurai, Kenji

    2016-09-01

    X-ray reflectivity is a promising technique for characterizing buried layers and interfaces in ultrathin films because of its ability to probe the electron density profile along the depth in a non-destructive manner. While routine X-ray reflectivity assumes the in-plane uniformity of the sample to be measured, it is also quite important to see buried inhomogeneous/patterned layers and interfaces. The present paper describes the addition of spatial resolution and imaging capability to an X-ray reflectivity technique to visualize surfaces and buried interfaces. To visualize quite wide viewing area size quickly, the image reconstruction scheme has been employed instead of the scanning of microbeam. Though the mathematics is quite close to X-ray computer tomography, the technique gives the image contrast caused by the difference in reflectivity at each in-plane point in the thin film sample. By choosing a grazing angle, the image gives inhomogeneity of X-ray reflectivity at the specific wavevector transfer. With a collimated monochromatic synchrotron X-ray beam of 0.05 mm (H) × 8 mm (V), the intensity profiles of X-ray reflection projections have been taken at many different in-plane rotation angles, from 0° to 180°. We have succeeded in visualizing buried layers and interfaces of the 8 mm dia area with the spatial resolution of better than 20 μm. Because of the brilliance of synchrotron radiation, the typical measuring time is shorter than 1 min. Three analytical cases have been discussed: (i) imaging of a buried layer and an interface covered by a protection layer, (ii) distinguishing different local parts of different thicknesses in an ultrathin film, and (iii) selective imaging of a specific metal in the thin film form.

  9. X-ray absorption fine structure (XAFS) studies of cobalt silicide thin films

    Energy Technology Data Exchange (ETDEWEB)

    Naftel, S.J.; Coulthard, I.; Hu, Y.; Sham, T.K.; Zinke-Allmang, M. [Univ. of Western Ontario, London, Ontario (Canada)

    1998-12-31

    Cobalt silicide thin films, prepared on Si(100) wafers, have been studied by X-ray absorption near edge structures (XANES) at the Si K-, L{sub 2,3}- and Co K-edges utilizing both total electron (TEY) and fluorescence yield (FLY) detection as well as extended X-ray absorption fine structure (EXAFS) at the Co K-edge. Samples made using DC sputter deposition on clean Si surfaces and MBE were studied along with a bulk CoSi{sub 2} sample. XANES and EXAFS provide information about the electronic structure and morphology of the films. It was found that the films studied have essentially the same structure as bulk CoSi{sub 2}. Both the spectroscopy and materials characterization aspects of XAFS (X-ray absorption fine structures) are discussed.

  10. Development and evaluation of gallium nitride-based thin films for x-ray dosimetry.

    Science.gov (United States)

    Hofstetter, Markus; Howgate, John; Sharp, Ian D; Stutzmann, Martin; Thalhammer, Stefan

    2011-06-07

    X-ray radiation plays an important role in medical procedures ranging from diagnostics to therapeutics. Due to the harm such ionizing radiation can cause, it has become common practice to closely monitor the dosages received by patients. To this end, precise online dosimeters have been developed with the dual objectives of monitoring radiation in the region of interest and improving therapeutic methods. In this work, we evaluate GaN thin film high electron mobility heterostructures with sub-mm(2) detection areas as x-ray radiation detectors. Devices were tested using 40-300 kV Bremsstrahlung x-ray sources. We find that the photoconductive device response exhibits a large gain, is almost independent of the angle of irradiation, and is constant to within 2% of the signal throughout this medical diagnostic x-ray range, indicating that these sensors do not require recalibration for geometry or energy. Furthermore, the devices show a high sensitivity to x-ray intensity and can measure in the air kerma rate (free-in-air) range of 1 µGy s(-1) to 10 mGy s(-1) with a signal stability of ±1% and a linear total dose response over time. Medical conditions were simulated by measurements of device responses to irradiation through human torso phantoms. Direct x-ray imaging is demonstrated using the index finger and wrist sections of a human phantom. The results presented here indicate that GaN-based thin film devices exhibit a wide range of properties, which make them promising candidates for dosimetry applications. In addition, with potential detection volumes smaller than 10(-6) cm(3), they are well suited for high-resolution x-ray imaging. Moreover, with additional engineering steps, these devices can be adapted to potentially provide both in vivo biosensing and x-ray dosimetry.

  11. Development and evaluation of gallium nitride-based thin films for x-ray dosimetry

    Energy Technology Data Exchange (ETDEWEB)

    Hofstetter, Markus; Thalhammer, Stefan [Helmholtz Zentrum Muenchen, Ingolstaedter Landstrasse 1, 85764 Neuherberg (Germany); Howgate, John; Sharp, Ian D; Stutzmann, Martin, E-mail: stefan.thalhammer@helmholtz-muenchen.de [Walter Schottky Institut, Technische Universitaet Muenchen, Am Coulombwall 3, 85748 Garching (Germany)

    2011-06-07

    X-ray radiation plays an important role in medical procedures ranging from diagnostics to therapeutics. Due to the harm such ionizing radiation can cause, it has become common practice to closely monitor the dosages received by patients. To this end, precise online dosimeters have been developed with the dual objectives of monitoring radiation in the region of interest and improving therapeutic methods. In this work, we evaluate GaN thin film high electron mobility heterostructures with sub-mm{sup 2} detection areas as x-ray radiation detectors. Devices were tested using 40-300 kV Bremsstrahlung x-ray sources. We find that the photoconductive device response exhibits a large gain, is almost independent of the angle of irradiation, and is constant to within 2% of the signal throughout this medical diagnostic x-ray range, indicating that these sensors do not require recalibration for geometry or energy. Furthermore, the devices show a high sensitivity to x-ray intensity and can measure in the air kerma rate (free-in-air) range of 1 {mu}Gy s{sup -1} to 10 mGy s{sup -1} with a signal stability of {+-}1% and a linear total dose response over time. Medical conditions were simulated by measurements of device responses to irradiation through human torso phantoms. Direct x-ray imaging is demonstrated using the index finger and wrist sections of a human phantom. The results presented here indicate that GaN-based thin film devices exhibit a wide range of properties, which make them promising candidates for dosimetry applications. In addition, with potential detection volumes smaller than 10{sup -6} cm{sup 3}, they are well suited for high-resolution x-ray imaging. Moreover, with additional engineering steps, these devices can be adapted to potentially provide both in vivo biosensing and x-ray dosimetry.

  12. Radiation exposure of the UK population from medical and dental x-ray examinations

    Energy Technology Data Exchange (ETDEWEB)

    Hart, D.; Wall, B.F

    2002-03-01

    Knowledge of recent trends in the radiation doses from x-ray examinations and their distribution for the UK population provides useful guidance on where best to concentrate efforts on patient dose reduction in order to optimise the protection of the population in a cost-effective manner. In this report, the results of a recent survey of the frequency of medical and dental x-ray examinations in the UK and contemporary data on the radiation doses typically received by patients, are used to assess trends in the extent and the pattern of the population exposure. Individual patient doses, expressed in terms of the effective dose, range from a few microsieverts for simple radiographic examinations of the teeth, limbs or chest to tens of millisieverts for prolonged fluoroscopic procedures or some computed tomography (CT) examinations. A total of about 41.5 million medical and dental x-ray examinations are now conducted each year in the UK (0.70 examination per head of population) resulting in an annual per caput effective dose of 330 {mu}Sv. This is not significantly different from the previous rough estimate of 350 {mu}Sv for 1991. However, over the last ten years CT has more than doubled its contribution and is now responsible for 40% of the total dose to the population from medical x-rays. In contrast, the contribution from conventional radiographic and fluoroscopic examinations has nearly halved to about 44%. Interventional and angiographic procedures together contribute the remaining 16%. The annual per caput dose of 330 {mu}Sv is low in comparison with other countries having similarly developed systems of health care. This is due to both a lower frequency of x-ray examinations per head of population and generally lower doses in the UK than in other developed countries. However, the much increased contributions of CT, angiography and interventional procedures to the UK population dose indicate an urgent need to develop radiation protection and optimisation activities

  13. The dose received by patients during dental X-ray examination and the technical condition of radiological equipment

    Directory of Open Access Journals (Sweden)

    Marcin Bekas

    2013-12-01

    Full Text Available Background: Implementation of X-ray dental examination is associated with the patient's exposure to ionizing radiation. The size of the exposure depends on the type of medical procedure, the technical condition of the X-ray unit and selected exposure conditions. The aim of this study was to determine the dose received by patients during dental X-ray examination and the assessment of the technical condition of medical equipment. Materials and Methods: The study included a total number of 79 dental X-ray units located in the region of Mazovia. The test methods for the assessment of the technical condition of dental X-ray units and measurement of radiation dose received by patients were based on the procedures elaborated in the Department of Radiation Hygiene and Radiobiology in the National Institute of Public Health - National Institute of Hygiene (Warszawa, Poland accredited for the certification of compliance with PN-EN 17025. Results: The research found that 69.6% fully meets the criteria set out in the Polish legislation regarding the safe use of ionizing radiation in medicine, while 30.4% did not meet some of them. A tenfold difference in the size of the dose received by patients during dental X-ray examinations was discovered. For example, during a radiography of the canine teeth of a child, the recorded entrance surface dose (ESD ranged from 72.8 to 2430 μGy with the average value of 689.1 μGy. Cases where the dose reference level defined in Polish legislation of 5 mGy was exceeded were also found. Conclusions: It is essential to constantly monitor the situation regarding the technical condition of X-ray units which affects the size of the population's exposure to ionizing radiation as well as raising dentists' awareness about the effects of X-rays on the human body. Med Pr 2013;64(6:755–759

  14. X-ray diffractometer stage for in situ structural analysis of thin films

    OpenAIRE

    1988-01-01

    A theta-two theta x-ray diffractometer stage has been developed for in situ structural characterization of thin-film samples. This stage integrates an ultrahigh vacuum dc ion-beam thin-film sample preparation chamber with the Siemens D500 x-ray diffractometer. In vacuo sample translation and manipulation is provided. The stage incorporates resistive heating to 900 K and liquid nitrogen cooling to 150 K. The sample theta rotation is transmitted into the vacuum chamber by a rotary feedthrough. ...

  15. X-rays diffraction on a new chromium oxide single-crystal thin film prepared by molecular beam epitaxy

    NARCIS (Netherlands)

    Du, X. S.; Hak, S.; Hibma, T.; Rogojanu, O. C.; Struth, B.

    2006-01-01

    Chromium oxide films were prepared on MgO substrates by molecular beam epitaxy. The crystalline structure of the films was characterized by X-ray diffraction (XRD) with conventional as well as synchrotron X-ray sources. The theta-2 theta spectra showed that the film was a new chromium oxide epitaxia

  16. X-rays diffraction on a new chromium oxide single-crystal thin film prepared by molecular beam epitaxy

    NARCIS (Netherlands)

    Du, X. S.; Hak, S.; Hibma, T.; Rogojanu, O. C.; Struth, B.

    2006-01-01

    Chromium oxide films were prepared on MgO substrates by molecular beam epitaxy. The crystalline structure of the films was characterized by X-ray diffraction (XRD) with conventional as well as synchrotron X-ray sources. The theta-2 theta spectra showed that the film was a new chromium oxide

  17. A nano-structured ZnO film as diagnostic X-ray sensor

    Energy Technology Data Exchange (ETDEWEB)

    Valenca, Claudia Patricia Varela; Liborio da Silveira, Matheus Augusto; Macedo, Marcelo Andrade; Pereira dos Santos, Luiz Antonio [CNEN/CRCN-NE Av. Prof. Luiz Freire, 1 Cidade Universitaria RECIFE-PE CEP 50740-540 (Brazil)

    2015-07-01

    Currently some international organizations such as WHO and IAEA have shown concerns about the quality of diagnostic services in clinics and hospitals that use ionizing radiation. In fact, the IAEA recommend that the characteristics of the X-ray beam must be adjusted to obtain the highest quality of the radiographic image with the minimum exposure to the patient. Several types of detectors may be used for monitoring X-ray beams, such as: ionization chamber, photodiode, phototransistor, among others. Recently nano-structured films made of various types of metal oxide materials have been used for various technological applications. Accordingly, the purpose of this paper is to present a sort of device based on a nano-structured zinc oxide (ZnO) to operate as a diagnostic X-ray sensor. By depositing a thin film on the glass substrate some ZnO semiconductor samples were built by sputtering techniques and then mounted in a BNC type connector to perform the electrical characterization. To test the device, we choose a standard X-Ray beam, the RQR9 radiation quality, which is normally used as the tool and condition for calibrating diagnostic X-Ray instruments in the energy range of computed tomography, in accordance with the stated requirements of IEC 61267. A 6430 sub-femto-ammeter, Keithley, was used as electrometer to perform the output readings and simultaneously bias the ZnO sensor. Analysis of the angular dependence and the dose rate were performed to evaluate how the device responds under the RQR9 radiation spectra. Although the results have shown that the ZnO film presents a certain angular dependence, if an angle of incidence of photons is selected, the device displays reproducibility as X-ray sensor and has the feature of radiation hardness unlike other types of semiconductor electronic devices typically used as an X-ray detector. (authors)

  18. X-ray diffraction analysis of residual stress in zirconia dental composites

    Science.gov (United States)

    Allahkarami, Masoud

    Dental restoration ceramic is a complex system to be characterized. Beside its essential biocompatibility, and pleasant appearance, it requires being mechanically strong in a catastrophic loading environment. Any design is restricted with geometry boundary and material property limits. Inspired by natural teeth, a multilayer ceramic is a smart way of achieving an enhanced restoration. Bi-layers of zirconia core covered by porcelain are known as one of the best multilayer restorations. Residual stresses may be introduced into a bi-layer dental ceramic restoration during its entire manufacturing process due to thermal expansion and elastic property mismatch. It is impossible to achieve a free of residual stresses bi-layer zirconia-porcelain restoration. The idea is to take the advantage of residual stress in design in such a way to prevent the crack initiation and progression. The hypothesis is a compressive residual stress at external contact surface would be enabling the restoration to endure a greater tensile stress. Optimizing the layers thickness, manufacturing process, and validating 3D simulations require development of new techniques of thickness, residual stresses and phase transformation measurement. In the present work, a combined mirco-tomography and finite element based method were adapted for thickness measurement. Two new 2D X-ray diffraction based techniques were adapted for phase transformation area mapping and combined phase transformation and residual stress measurement. Concerning the complex geometry of crown, an efficient method for X-ray diffraction data collection mapping on a given curved surface was developed. Finally a novel method for 3D dimensional x-ray diffraction data collection and visualization were introduced.

  19. Small-Angle X-Ray Scattering Study on Nanostructures of Polyimide Films

    Institute of Scientific and Technical Information of China (English)

    LIU Xiao-Xu; YIN Jing-Hua; SUN Dao-Bin; BU Wen-Bin; CHENG Wei-Dong; WU Zhong-Hua

    2010-01-01

    @@ Inorganic nanohybrid polyimide(PI)is widely applied in electrical and electronic devices for its outstanding insulating properties.Samples 100CR and 100NH are made in Dupont.Among them,100NH is a kind of pure PI films; however,100CR is a kind of inorganic nanohybrid PI/films with excellent corona-resistance.The nanostructure of PI films is investigated with small-angle x-ray scattering technique and transmission electron microscopy(TEM).

  20. X-ray scattering evaluation of ultrastructural changes in human dental tissues with thermal treatment.

    Science.gov (United States)

    Sandholzer, Michael A; Sui, Tan; Korsunsky, Alexander M; Walmsley, Anthony Damien; Lumley, Philip J; Landini, Gabriel

    2014-05-01

    Micro- and ultrastructural analysis of burned skeletal remains is crucial for obtaining a reliable estimation of cremation temperature. Earlier studies mainly focused on heat-induced changes in bone tissue, while this study extends this research to human dental tissues using a novel quantitative analytical approach. Twelve tooth sections were burned at 400-900°C (30-min exposure, increments of 100°C). Subsequent combined small- and wide-angle X-ray scattering (SAXS/WAXS) experiments were performed at the Diamond Light Source synchrotron facility, where 28 scattering patterns were collected within each tooth section. In comparison with the control sample, an increase in mean crystal thickness was found in burned dentine (2.8-fold) and enamel (1.4-fold), however at a smaller rate than reported earlier for bone tissue (5-10.7-fold). The results provide a structural reference for traditional X-ray scattering methods and emphasize the need to investigate bone and dental tissues separately to obtain a reliable estimation of cremation temperature.

  1. Radiation exposure to foetus and breasts from dental X-ray examinations: effect of lead shields.

    Science.gov (United States)

    Kelaranta, Anna; Ekholm, Marja; Toroi, Paula; Kortesniemi, Mika

    2016-01-01

    Dental radiography may involve situations where the patient is known to be pregnant or the pregnancy is noticed after the X-ray procedure. In such cases, the radiation dose to the foetus, though low, needs to be estimated. Uniform and widely used guidance on dental X-ray procedures during pregnancy are presently lacking, the usefulness of lead shields is unclear and practices vary. Upper estimates of radiation doses to the foetus and breasts of the pregnant patient were estimated with an anthropomorphic female phantom in intraoral, panoramic, cephalometric and CBCT dental modalities with and without lead shields. The upper estimates of foetal doses varied from 0.009 to 6.9 μGy, and doses at the breast level varied from 0.602 to 75.4 μGy. With lead shields, the foetal doses varied from 0.005 to 2.1 μGy, and breast doses varied from 0.002 to 10.4 μGy. The foetal dose levels without lead shielding were <1% of the annual dose limit of 1 mSv for a member of the public. Albeit the relative shielding effect, the exposure-induced increase in the risk of breast cancer death for the pregnant patient (based on the breast dose only) and the exposure-induced increase in the risk of childhood cancer death for the unborn child are minimal, and therefore, need for foetal and breast lead shielding was considered irrelevant. Most important is that pregnancy is never a reason to avoid or to postpone a clinically justified dental radiographic examination.

  2. Radiation exposure to foetus and breasts from dental X-ray examinations: effect of lead shields

    Science.gov (United States)

    Ekholm, Marja; Toroi, Paula; Kortesniemi, Mika

    2016-01-01

    Objectives: Dental radiography may involve situations where the patient is known to be pregnant or the pregnancy is noticed after the X-ray procedure. In such cases, the radiation dose to the foetus, though low, needs to be estimated. Uniform and widely used guidance on dental X-ray procedures during pregnancy are presently lacking, the usefulness of lead shields is unclear and practices vary. Methods: Upper estimates of radiation doses to the foetus and breasts of the pregnant patient were estimated with an anthropomorphic female phantom in intraoral, panoramic, cephalometric and CBCT dental modalities with and without lead shields. Results: The upper estimates of foetal doses varied from 0.009 to 6.9 μGy, and doses at the breast level varied from 0.602 to 75.4 μGy. With lead shields, the foetal doses varied from 0.005 to 2.1 μGy, and breast doses varied from 0.002 to 10.4 μGy. Conclusions: The foetal dose levels without lead shielding were shielding effect, the exposure-induced increase in the risk of breast cancer death for the pregnant patient (based on the breast dose only) and the exposure-induced increase in the risk of childhood cancer death for the unborn child are minimal, and therefore, need for foetal and breast lead shielding was considered irrelevant. Most important is that pregnancy is never a reason to avoid or to postpone a clinically justified dental radiographic examination. PMID:26313308

  3. Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission Spectroscopy

    Directory of Open Access Journals (Sweden)

    G. Biasotto

    2010-01-01

    Full Text Available CaBi4Ti4O15 (CBTi144 thin films were grown on Pt/Ti/SiO2/Si substrates using a soft chemical solution and spin-coating method. Structure and morphology of the films were characterized by the X-ray Diffraction (XRD, Fourier-transform infrared spectroscopy (FT-IR, Raman analysis, X-ray photoemission spectroscopy (XPS, and transmission electron microscopy (TEM. The films present a single phase of layered-structured perovskite with polar axis orient. The a/b-axis orientation of the ferroelectric film is considered to be associated with the preferred orientation of the Pt bottom electrode. XPS measurements were employed to understand the nature of defects on the retention behavior of CBTi144 films. We have observed that the main source of retention-free characteristic of the capacitors is the oxygen environment in the CBTi144 lattice.

  4. Introduction to Advanced X-ray Diffraction Techniques for Polymeric Thin Films

    Directory of Open Access Journals (Sweden)

    Nicodemus Edwin Widjonarko

    2016-11-01

    Full Text Available X-ray diffraction has been a standard technique for investigating structural properties of materials. However, most common applications in the organic materials community have been restricted to either chemical identification or qualitative strain analysis. Moreover, its use for polymeric thin films has been challenging because of the low structure factor of carbon and the thin film nature of the sample. Here, we provide a short review of advanced X-ray diffraction (XRD techniques suitable for polymeric thin films, including the type of analysis that can be done and measurement geometries that would compensate low signals due to low carbon structure factor and the thin film nature of the sample. We will also briefly cover the χ -pole figure for texture analysis of ultra-thin film that has recently become commonly used. A brief review of XRD theory is also presented.

  5. Evaluation of X-ray Protection Methods Used in Dental Offices in Tabriz in 2005-2006

    Directory of Open Access Journals (Sweden)

    Esrafil Balaei

    2007-06-01

    Full Text Available

    Background and aims. The aim of this study was to evaluate x-ray protection methods in dental offices in Tabriz.

    Materials and methods. In this study 142 dental offices were evaluated. A questionnaire-based method was used. The data was analyzed by descriptive methods.

    Results. The least commonly used methods were leaded walls (4.9% and film badges (16.9% and the most commonly used methods were lead partitions (67.6% and position-distance rule (68.3%. The most commonly used patient protection devices were E-speed films (84.5% and long collimators (66.2%. The least commonly used methods, in this respect, were automatic processors (2.1% and rectangular collimators (0%.

    Conclusion. Regarding protection methods for the patient, results did not conform to international standards. Mostly, manual processing was used, resulting in extra radiation dose to patients. The methods which reduce the received dose of patients were disregarded in offices compared to educational centers, necessitating optimization of educational programs in these fields.

  6. A Nanocomposite Shield Constructed for Protection Against the Harmful Effects of Dental X-Rays

    Directory of Open Access Journals (Sweden)

    Simel Ayyıldız

    2015-10-01

    Full Text Available Objectives: This study aimed to compare a number of new nanocomposites capable of pro- tecting the jaw from ionizing radiation.Materials and Methods: Four different types of nano-powders [Ti, Zr (IV oxide, Ag and Co] were mixed in a polymer matrix to create nano-composites with doping values of 8% in weight. Small-angle X-ray scattering (SAXS analysis was performed using a HECUS- SAXS system with 50 kV- 50 mA. Co nano-composites (Co-pnm yielded the most prom- ising values of the 4 nanocomposites tested in terms of x-ray absorption. Thus, 4x2 cm Co- pnm samples of different thicknesses (0.20, 0.50, 0.57 and 0.60 cm were prepared, and SAXS analysis was performed in order to assess the effects of material thickness on x-ray absorption. An experimental multi part shield was constructed from Co-pnm around tooth#36 to test the effect of nanomaterial on the image quality under X-ray beam.Results: Logarithmic distributions of the transmitted intensity values (I showed that 0.20 cm Co-pnm had the highest transmission value (16.05 followed by 0.50 cm Co-pnm (15.44, 0.57 cm Co-pnm (15.07 and 0.60 cm Co-pnm (15.06. The 0.2 cm Co-pnm had an effective radius of the nano-aggregation value (77.44 Å lower than that of the other thick- nesses (0.50, 0.57 and 0.60 cm of Co-pnm, which had similar values ranging from 66.22-66.34 Å. The 0.50 cm Co-pnm had the lowest Dmax value of the different thicknesses of Co- pnm tested.Conclusion: Co nanocomposite can be used as a protection shield for the harmful effects of dental X-ray.

  7. Synchrotron-radiation-based X-ray micro-computed tomography reveals dental bur debris under dental composite restorations.

    Science.gov (United States)

    Hedayat, Assem; Nagy, Nicole; Packota, Garnet; Monteith, Judy; Allen, Darcy; Wysokinski, Tomasz; Zhu, Ning

    2016-05-01

    Dental burs are used extensively in dentistry to mechanically prepare tooth structures for restorations (fillings), yet little has been reported on the bur debris left behind in the teeth, and whether it poses potential health risks to patients. Here it is aimed to image dental bur debris under dental fillings, and allude to the potential health hazards that can be caused by this debris when left in direct contact with the biological surroundings, specifically when the debris is made of a non-biocompatible material. Non-destructive micro-computed tomography using the BioMedical Imaging & Therapy facility 05ID-2 beamline at the Canadian Light Source was pursued at 50 keV and at a pixel size of 4 µm to image dental bur fragments under a composite resin dental filling. The bur's cutting edges that produced the fragment were also chemically analyzed. The technique revealed dental bur fragments of different sizes in different locations on the floor of the prepared surface of the teeth and under the filling, which places them in direct contact with the dentinal tubules and the dentinal fluid circulating within them. Dispersive X-ray spectroscopy elemental analysis of the dental bur edges revealed that the fragments are made of tungsten carbide-cobalt, which is bio-incompatible.

  8. Structure of reactively sputter deposited tin-nitride thin films: A combined X-ray photoelectron spectroscopy, in situ X-ray reflectivity and X-ray absorption spectroscopy study

    Energy Technology Data Exchange (ETDEWEB)

    Luetzenkirchen-Hecht, Dirk [Fachbereich C-Physik, Bergische Universitaet Wuppertal, Gaussstr. 20, D-42097 Wuppertal (Germany)]. E-mail: dirklh@uni-wuppertal.de; Frahm, Ronald [Fachbereich C-Physik, Bergische Universitaet Wuppertal, Gaussstr. 20, D-42097 Wuppertal (Germany)

    2005-12-22

    Amorphous tin-nitride thin films were prepared by reactive sputter deposition on smooth float glass substrates in a vacuum chamber with an integrated small magnetron source. The films were investigated using in situ reflection mode X-ray absorption spectroscopy and ex situ X-ray photoelectron spectroscopy (XPS). Both the X-ray absorption near edge structure (XANES) and the extended X-ray absorption fine structure (EXAFS) were analysed, yielding bond distances, coordination numbers and Debye-Waller factors. XPS yields the chemical composition and the binding state of the constituents of the films, specular X-ray reflectivity allows the determination of the sample density and of the roughness and its changes with film thickness. The results were compared to those of crystalline Sn{sub 3}N{sub 4}, indicating that the electronic and atomic structure of the amorphous films determined by EXAFS data analysis are very similar to the stoichiometric reference compound. Two different Sn-N interactions with about 2.09 and 2.19 A bond distance and 4 and 6 nearest neighbours, respectively, are present. These bond distances are slightly relaxed compared to the crystalline reference material, which is consistent with the sample density, which is reduced by about 8% in comparison to Sn{sub 3}N{sub 4}. XPS as well as XANES revealed a Sn valence of about 4+ and the presence of nitric bonds, while XPS also suggests that the nitride is slightly decomposed under X-ray irradiation in ultra-high vacuum.

  9. A developer solution for tank processing of x-ray film under ambient, tropical conditions.

    Science.gov (United States)

    Wayrynen, R E; McKinney, W E

    1976-05-01

    A modification of a proprietary 90-sec. x-ray-film developer which permits its use as a hand-tank developer at ambient temperatures between 21.6 degrees-30.6 degrees C (80 degrees-100 degrees F) is described. This processing technique is useful in tropical countries where the control of developer temperature is particularly difficult.

  10. [Equipment for measuring the optical density of wide-format x-ray films].

    Science.gov (United States)

    Mikhaĭlov, V A; Ennenberg, M G

    1980-01-01

    For qualitative estimation of the dynamics of medical treatment in the patients with pulmonary diseases a device has been produced based on measuring the optical density of X-ray films. This device comprises the optical part of the microphotometer MF-2, a modified microscope stand, with its moving mechanism, electronic circuit with a logarithmic amplifier, control circuit and a double-coordinate-recorder.

  11. Rapid fitting of particle cascade development data from X-ray film densitometry measurements

    Science.gov (United States)

    Roberts, E.; Benson, Carl M.; Fountain, Walter F.

    1989-01-01

    A semiautomatic method of fitting transition curves to X-ray film optical density measurements of electromagnetic particle cascades is described. Several hundred singly and multiple interacting cosmic ray events from the JACEE 8 balloon flights were analyzed using this procedure. In addition to greatly increased speed compared to the previous manual method, the semiautomatic method offers increased accuracy through maximum likelihood fitting.

  12. Computer-aided recognition of dental implants in X-ray images

    Science.gov (United States)

    Morais, Pedro; Queirós, Sandro; Moreira, António H. J.; Ferreira, Adriano; Ferreira, Ernesto; Duque, Duarte; Rodrigues, Nuno F.; Vilaça, João. L.

    2015-03-01

    Dental implant recognition in patients without available records is a time-consuming and not straightforward task. The traditional method is a complete user-dependent process, where the expert compares a 2D X-ray image of the dental implant with a generic database. Due to the high number of implants available and the similarity between them, automatic/semi-automatic frameworks to aide implant model detection are essential. In this study, a novel computer-aided framework for dental implant recognition is suggested. The proposed method relies on image processing concepts, namely: (i) a segmentation strategy for semi-automatic implant delineation; and (ii) a machine learning approach for implant model recognition. Although the segmentation technique is the main focus of the current study, preliminary details of the machine learning approach are also reported. Two different scenarios are used to validate the framework: (1) comparison of the semi-automatic contours against implant's manual contours of 125 X-ray images; and (2) classification of 11 known implants using a large reference database of 601 implants. Regarding experiment 1, 0.97±0.01, 2.24±0.85 pixels and 11.12±6 pixels of dice metric, mean absolute distance and Hausdorff distance were obtained, respectively. In experiment 2, 91% of the implants were successfully recognized while reducing the reference database to 5% of its original size. Overall, the segmentation technique achieved accurate implant contours. Although the preliminary classification results prove the concept of the current work, more features and an extended database should be used in a future work.

  13. Grazing incidence X-ray absorption characterization of amorphous Zn-Sn-O thin film

    Science.gov (United States)

    Moffitt, S. L.; Ma, Q.; Buchholz, D. B.; Chang, R. P. H.; Bedzyk, M. J.; Mason, T. O.

    2016-05-01

    We report a surface structure study of an amorphous Zn-Sn-O (a-ZTO) transparent conducting film using the grazing incidence X-ray absorption spectroscopy technique. By setting the measuring angles far below the critical angle at which the total external reflection occurs, the details of the surface structure of a film or bulk can be successfully accessed. The results show that unlike in the film where Zn is severely under coordinated (N coordinated (N = 4) near the surface while the coordination number around Sn is slightly smaller near the surface than in the film. Despite a 30% Zn doping, the local structure in the film is rutile-like.

  14. Bone X-Ray (Radiography)

    Medline Plus

    Full Text Available ... holds the x-ray film or image recording plate . Sometimes the x-ray is taken with the ... an x-ray film holder or image recording plate is placed beneath the patient. top of page ...

  15. Bone X-Ray (Radiography)

    Medline Plus

    Full Text Available ... holds the x-ray film or image recording plate . Sometimes the x-ray is taken with the ... an x-ray film holder or image recording plate is placed beneath the patient. top of page ...

  16. Bone X-Ray (Radiography)

    Medline Plus

    Full Text Available ... drawer under the table holds the x-ray film or image recording plate . Sometimes the x-ray ... extended over the patient while an x-ray film holder or image recording plate is placed beneath ...

  17. Hard X-ray photoemission spectroscopy of transition-metal oxide thin films and interfaces

    Energy Technology Data Exchange (ETDEWEB)

    Wadati, H., E-mail: wadati@ap.t.u-tokyo.ac.jp [Department of Applied Physics and Quantum-Phase Electronics Center (QPEC), University of Tokyo, Hongo, Tokyo 113-8656 (Japan); Fujimori, A. [Department of Physics, University of Tokyo, Bunkyo-ku, Tokyo 113-0033 (Japan)

    2013-10-15

    Highlights: •Photoemission spectroscopy is a powerful technique to study the electronic structures of transition-metal oxides. •Hard X-ray photoemission spectroscopy (HXPES) is a new type of photoemission spectroscopy which can probe bulk states. •HXPES is very suitable for studying oxide thin films such as the composition dependence and the film thickness dependence. -- Abstract: Photoemission spectroscopy is a powerful experimental technique to study the electronic structures of solids, especially of transition-metal oxides. Recently, hard X-ray photoemission spectroscopy (HXPES) has emerged as a more relevant experimental technique to obtain clear information about bulk states. Here, we describe how HXPES can be conveniently applied to study the interesting subjects on oxide thin films such as the composition dependence and the film thickness dependence of the electronic structures and the interfacial electronic structure of multilayers.

  18. Metal screen-film detector MTF at megavoltage x-ray energies.

    Science.gov (United States)

    Droege, R T; Bjärngard, B E

    1979-01-01

    The MTF of metal screen film detectors used in radiation treatment verification has been measured at 4 and 8 MV x-ray energies. The results show that lead screens provide better resolution than copper screens, and a single-emulsion film offers considerable advantage over the traditional double-emulsion film. A rear lead screen was found to seriously degrade the resolution properties of a front lead screen single-emulsion film detector. The detector MTF was found to be energy dependent. In general, both the low and the high spatial frequency response decreased with increasing x-ray energy. This, in part, accounts for the noticeable image quality difference between 4 and 8 MV radiographs.

  19. Ultrafast lattice response of photoexcited thin films studied by X-ray diffraction

    Directory of Open Access Journals (Sweden)

    Daniel Schick

    2014-11-01

    Full Text Available Using ultrafast X-ray diffraction, we study the coherent picosecond lattice dynamics of photoexcited thin films in the two limiting cases, where the photoinduced stress profile decays on a length scale larger and smaller than the film thickness. We solve a unifying analytical model of the strain propagation for acoustic impedance-matched opaque films on a semi-infinite transparent substrate, showing that the lattice dynamics essentially depend on two parameters: One for the spatial profile and one for the amplitude of the strain. We illustrate the results by comparison with high-quality ultrafast X-ray diffraction data of SrRuO3 films on SrTiO3 substrates.

  20. Structure determination of thin CoFe films by anomalous x-ray diffraction

    Energy Technology Data Exchange (ETDEWEB)

    Gloskovskii, Andrei; Stryganyuk, Gregory; Ouardi, Siham [Institut fuer Anorganische und Analytische Chemie, Johannes Gutenberg-Universitaet, 55099 Mainz (Germany); Fecher, Gerhard H.; Felser, Claudia [Institut fuer Anorganische und Analytische Chemie, Johannes Gutenberg-Universitaet, 55099 Mainz (Germany); Max Planck Institute for Chemical Physics of Solids, D-01187 Dresden (Germany); Hamrle, Jaroslav; Pistora, Jaromir [Department of Physics and Nanotechnology Centre, VSB-Technical University of Ostrava, 70833 Ostrava (Czech Republic); Bosu, Subrojati; Saito, Kesami; Sakuraba, Yuya; Takanashi, Koki [Institute for Materials Research (IMR), Tohoku University, Sendai 980-8577 (Japan)

    2012-10-01

    This work reports on the investigation of structure-property relationships in thin CoFe films grown on MgO. Because of the very similar scattering factors of Fe and Co, it is not possible to distinguish the random A2 (W-type) structure from the ordered B2 (CsCl-type) structure with commonly used x-ray sources. Synchrotron radiation based anomalous x-ray diffraction overcomes this problem. It is shown that as grown thin films and 300 K post annealed films exhibit the A2 structure with a random distribution of Co and Fe. In contrast, films annealed at 400 K adopt the ordered B2 structure.

  1. Evaluation of multiaxial stress in textured cubic films by x-ray diffraction

    Institute of Scientific and Technical Information of China (English)

    Zhang Jian-Min; Xu Ke-Wei

    2005-01-01

    X-ray diffraction is used extensively to determine the residual stress in bulk or thin film materials on the assumptions that the material is composed of fine crystals with random orientation and the stress state is biaxial and homogeneous through the x-ray penetrating region. The stress is calculated from the gradient of ε~ sin2 ψ linear relation. But the method cannot be used in textured films due to nonlinear relation. In this paper, a novel method is proposed for measuring the multiaxial stresses in cubic films with any [hkl] fibre texture. As an example, a detailed analysis is given for measuring three-dimensional stresses in FCC films with [111] fibre texture.

  2. Magnetism in heterogeneous thin film systems: Resonant x-ray scattering studies

    Energy Technology Data Exchange (ETDEWEB)

    Kortright, J.B.; Jiang, J.S.; Bader, S.D.; Hellwig, O.; Marguiles, D.T.; Fullerton, E.E.

    2002-10-28

    Magnetic and chemical heterogeneity are common in a broad range of magnetic thin film systems. Emerging resonant soft x-ray scattering techniques are well suited to resolve such heterogeneity at relevant length scales. Resonant x-ray magneto-optical Kerr effect measurements laterally average over heterogeneity but can provide depth resolution in different ways, as illustrated in measurements resolving reversible and irreversible changes in different layers of exchange-spring heterostructures. Resonant small-angle scattering measures in-plane heterogeneity and can resolve magnetic and chemical scattering sources in different ways, as illustrated in measurements of granular alloy recording media.

  3. X-ray scattering from freestanding polymer films with geometrically curved surfaces

    OpenAIRE

    D.J. Lee; K. Shin; Seeck, O; Kim, H.; Seo, Y.-S.; Tolan, M.; Rafailovich, M. H.; Sokolov, J.; Sinha, S.K.

    2003-01-01

    We show that the x-ray surface scattering from a freestanding polymer film exhibits features that cannot be explained by the usual stochastic formalism for surfaces with random height fluctuations. Instead, a geometric description of the film morphology assuming two curved surfaces characterized by a radius of curvature and a lateral cutoff length successfully accounts for the phase difference between the Kiessig fringes of the nominal "specular" and "off-specular" components of the scatterin...

  4. Elastic modulus of TiN film investigated with Kroner model and X-ray diffraction

    Institute of Scientific and Technical Information of China (English)

    2001-01-01

    The four-point bending method was applied to measure X-ray elastic constants(XEC) of (422) and (331) planes of TiN coating. Elastic Modulus and XECs of all the crystal planes were calculated by Kroner method. The results from the calculation and the experiment were compared. It is concluded that the XECs values of same film prepared by different techniques scatter a little because of the effects of stoichiometric proportion and microstructure of films.

  5. Roles of Thin Film Stress in Making Extremely Lightweight X-Ray Optics

    Science.gov (United States)

    Zhang, William W.

    2010-01-01

    X-ray optics typically must be coated with one of the noble metals, gold, platinum, or iridium, to enhance their photon collection area. In general, iridium is preferred to the other two because it generates the highest X-ray reflectivity in the I to 10 keV band. Unfortunately, iridium films typically have also the highest stress that can severely degrade the optical figure of the mirror substrate, resulting in a poorer image quality. In this paper we will report our work in understanding this stress and our method to counterbalance it. In particular we will also report on potential ways of using this stress to improve the substrate's optical figure, turning a bug into a desirable feature. This work is done in the context of developing an enabling technology for the International X-ray Observatory which is a collaborative mission of NASA, ESA, and JAXA, and expected to be launched into an L2 orbit in 2021.

  6. Experimental elucidation: microscopic mechanism of resonant X-ray scattering in manganite films

    CERN Document Server

    Ohsumi, H; Kiyama, T

    2003-01-01

    Resonant X-ray scattering experiments have been performed on perovskite manganite La sub 0 sub . sub 5 Sr sub 0 sub . sub 5 MnO sub 3 thin films, which are grown on three distinct perovskite with a coherent epitaxial strain and have a forced ferro-type orbital ordering of Mn 3d orbitals. Using an interference technique, we have successfully observed the resonant X-ray scattering signal from the system having the ferro-type orbital ordering and also revealed the energy scheme of Mn 4p bands. For the forced ferro-type orbital ordering system, the present results evidence that the resonant X-ray scattering signal originates from the band structure effect due to the Jahn-Teller distortion of a MnO sub 6 octahedron, and not from the Coulomb interaction between 3d and 4p electrons. (author)

  7. Drywall plates evaluation as protection barriers in dental X-rays and mammography facilities; Evaluacion de placas de drywall como barreras de proteccion en instalaciones de rayos X dental y mamografia

    Energy Technology Data Exchange (ETDEWEB)

    Guevara R, V. Y.; Romero C, N. [Empresa QC DOSE S. A. C., Av. Tomas Marsano 1915, Surquillo, Lima 34 (Peru); Berrocal T, M., E-mail: vguevara@qcdose.com [Universidad Nacional Mayor de San Marcos, C. German Amezaga 375, Edif. Jorge Basadre, Ciudad Universitaria, Lima 1 (Peru)

    2014-08-15

    In the dental X-rays and mammography facilities, usually lead shielded walls as protective barriers are used. Lead is a good attenuator for X-rays, but has toxic properties and its cost is high. Mammography equipment s emit low-energy photons in the range of 25 keV to 35 keV, on current computers; the primary radiation beam is intercepted by the image receptor. Peri apical dental equipment s emit photons in the range of 50 to 90 keV, their filtration is fixed. These devices emit a collimated beam whose diameter is slightly larger than the diagonal dimension of a standard film of dental X-rays. When a dental x-ray is performed, the radiation beam is partially attenuated by the patient. Drywall is a material consisting of plasterboard between two cardboard layers, being its components gypsum and cellulose generally. It is used in construction for execution of interior walls, ceilings and wall coverings, could also serve as a replacement for lead as well as other materials. In this paper three drywall prototypes (Giplac), formed with 02, 04 and 06 drywall layers (13, 16 and 20 cm of thickness respectively) were tested as barriers against primary and secondary X-ray radiation that come from dental and mammography equipment s. The results show that the drywall prototype, 02 layers, efficiently attenuates the secondary radiation beam produced by conventional mammography equipment. And the prototype 04 and 06 layers, efficiently attenuates the primary radiation beam produced by peri apical dental equipment. (author)

  8. Advances in thin film diffraction instrumentation by X-ray optics

    Energy Technology Data Exchange (ETDEWEB)

    Haase, A. [Rich. Seifert and Co., Analytical X-ray Systems, Ahrensburg (Germany)

    1996-09-01

    The structural characterisation of thin films requires a parallel X-ray beam of high intensity. Parallel beam geometry is commonly used in high resolution and single crystal experiments, but also in the field of X-ray diffraction for polycrystalline material (e.g. in phase, texture and stress analysis). For grazing incidence diffraction (GID), the use of small slits on the primary side and of long soller slits with a flat monochromator on the secondary side is standard. New optical elements have been introduced with polychromatic or monochromatic radiation. By means of different applications the results are compared with those of classical beam optics. X-ray fiber optics utilize total external reflection of X-rays on smooth surfaces. Effects of monochromatization are presented. In many fields of application, fiber optics may replace conventional collimators. The use of primary and secondary channel cut crystals can also produce a high parallel monochromatic X-ray beam. A parabolically bent graded multilayer produces a monochromatic parallel beam of high intensity. Compared with classical Bragg-Brentano (focussing) geometry, excellent results have been obtained, especially for samples with an irregular shape. In combination with a channel cut monochromator there is a substantial gain in intensity leading to an increase of the dynamic intensity range of rocking curves.

  9. Direct X-ray photoconversion in flexible organic thin film devices operated below 1 V

    Science.gov (United States)

    Basiricò, Laura; Ciavatti, Andrea; Cramer, Tobias; Cosseddu, Piero; Bonfiglio, Annalisa; Fraboni, Beatrice

    2016-10-01

    The application of organic electronic materials for the detection of ionizing radiations is very appealing thanks to their mechanical flexibility, low-cost and simple processing in comparison to their inorganic counterpart. In this work we investigate the direct X-ray photoconversion process in organic thin film photoconductors. The devices are realized by drop casting solution-processed bis-(triisopropylsilylethynyl)pentacene (TIPS-pentacene) onto flexible plastic substrates patterned with metal electrodes; they exhibit a strong sensitivity to X-rays despite the low X-ray photon absorption typical of low-Z organic materials. We propose a model, based on the accumulation of photogenerated charges and photoconductive gain, able to describe the magnitude as well as the dynamics of the X-ray-induced photocurrent. This finding allows us to fabricate and test a flexible 2 × 2 pixelated X-ray detector operating at 0.2 V, with gain and sensitivity up to 4.7 × 104 and 77,000 nC mGy-1 cm-3, respectively.

  10. Modulation transfer function of a digital dental x-ray system.

    Science.gov (United States)

    Chen, S K; Hollender, L

    1994-03-01

    An impulse train method to control aliasing was used to measure the modulation transfer function of a digital dental x-ray system (RVG 32000 ZHR, Trophy Radiologie, Vincennes, France). The detector of this system is composed of an intensifying screen, a fiber optics taper, and a charged couple device chip. The modulation transfer function could not be measured by impulse method such as the line spread function or edge response function because of aliasing from undersampling of the digital system. The system modulation transfer function was difficult to recover at the spatial frequencies smaller than the Nyquist frequency. The modulation transfer function beyond the Nyquist frequencies was impossible to recover in this study.

  11. The dental X-ray file of crew members in the Scandinavian Airlines System (SAS).

    Science.gov (United States)

    Keiser-Nielsen, S; Johanson, G; Solheim, T

    1981-11-01

    In 1977, the Scandinavian Airlines System (SAS) established a dental X-ray file of all crew members. Its aim was to have immediately available an adequate set of physical antemortem data useful for identification in case of a fatal crash. Recently, an investigation into the quality and suitability of this material was carried out. The radiographs of 100 Danish, 100 Norwegian, and 100 Swedish pilots were picked at random and evaluated for formal deficiences, technical deficiencies, treatment pattern as useful for identification purposes, and the presence of pathology. The major results of the investigation were that a number of formal and technical deficiencies were disclosed, that the treatment pattern would seem adequate for identification purposes, and that a number of pathological findings were made, several of which had to be considered possible safety risks in the form of barodontalgia.

  12. Sputter deposition of PZT piezoelectric films on thin glass substrates for adjustable x-ray optics.

    Science.gov (United States)

    Wilke, Rudeger H T; Johnson-Wilke, Raegan L; Cotroneo, Vincenzo; Davis, William N; Reid, Paul B; Schwartz, Daniel A; Trolier-McKinstry, Susan

    2013-05-10

    Piezoelectric PbZr(0.52)Ti(0.48)O(3) (PZT) thin films deposited on thin glass substrates have been proposed for adjustable optics in future x-ray telescopes. The light weight of these x-ray optics enables large collecting areas, while the capability to correct mirror figure errors with the PZT thin film will allow much higher imaging resolution than possible with conventional lightweight optics. However, the low strain temperature and flexible nature of the thin glass complicate the use of chemical-solution deposition due to warping of the substrate at typical crystallization temperatures for the PZT. RF magnetron sputtering enabled preparation of PZT films with thicknesses up to 3 μm on Schott D263 glass substrates with much less deformation. X-ray diffraction analysis indicated that the films crystallized with the perovskite phase and showed no indication of secondary phases. Films with 1 cm(2) electrodes exhibited relative permittivity values near 1100 and loss tangents below 0.05. In addition, the remanent polarization was 26 μC/cm(2) with coercive fields of 33 kV/cm. The transverse piezoelectric coefficient was as high as -6.1±0.6 C/m(2). To assess influence functions for the x-ray optics application, the piezoelectrically induced deflection of individual cells was measured and compared with finite-element-analysis calculations. The good agreement between the results suggests that actuation of PZT thin films can control mirror figure errors to a precision of about 5 nm, allowing sub-arcsecond imaging.

  13. Recent Developments in the X-Ray Reflectivity Analysis for Rough Surfaces and Interfaces of Multilayered Thin Film Materials

    OpenAIRE

    Yoshikazu Fujii

    2013-01-01

    X-ray reflectometry is a powerful tool for investigations on rough surface and interface structures of multilayered thin film materials. The X-ray reflectivity has been calculated based on the Parratt formalism, accounting for the effect of roughness by the theory of Nevot-Croce conventionally. However, in previous studies, the calculations of the X-ray reflectivity often show a strange effect where interference effects would increase at a rough surface. And estimated surface and interface ro...

  14. Abdominal x-ray

    Science.gov (United States)

    ... are, or may be, pregnant. Alternative Names Abdominal film; X-ray - abdomen; Flat plate; KUB x-ray ... Assistant Studies, Department of Family Medicine, UW Medicine, School of Medicine, University of Washington, Seattle, WA. Also ...

  15. Soft X-Ray Magnetic Imaging of Focused Ion Beam Lithographically Patterned Fe Thin Films

    Energy Technology Data Exchange (ETDEWEB)

    Cook, Paul J.; Shen, Tichan H.; Grundy, PhilJ.; Im, Mi Young; Fischer, Peter; Morton, Simon A.; Kilcoyne, Arthur D.L.

    2008-11-09

    We illustrate the potential of modifying the magnetic behavior and structural properties of ferromagnetic thin films using focused ion beam 'direct-write' lithography. Patterns inspired by the split-ring resonators often used as components in meta-materials were defined upon 15 nm Fe films using a 30 keV Ga{sup +} focused ion beam at a dose of 2 x 10{sup 16} ions cm{sup -2}. Structural, chemical and magnetic changes to the Fe were studied using transmission soft X-ray microscopy at the ALS, Berkeley CA. X-ray absorption spectra showed a 23% reduction in the thickness of the film in the Ga irradiated areas, but no change to the chemical environment of Fe was evident. X-ray images of the magnetic reversal process show domain wall pinning around the implanted areas, resulting in an overall increase in the coercivity of the film. Transmission electron microscopy showed significant grain growth in the implanted regions.

  16. Radiation-induced thumbs carcinoma due to practicing dental X-ray

    OpenAIRE

    Halboub, Esam S; Imad Barngkgei; Osama Alsabbagh; Omar Hamadah

    2015-01-01

    Dealing with diagnostic X-ray radiation may result in serious health problems, unless protection guidelines are followed. This became prevalent immediately a decade following the invention of X-ray radiation, where it had not been known that the accumulative exposure to X-ray radiation may carry huge health hazards. The reoccurrence of various fatal cancer cases compelled the concerned health authorities to develop safety standards to be followed by all X-ray clinics and technicians worldwide...

  17. Quantification of thin film crystallographic orientation using X-ray diffraction with an area detector.

    Science.gov (United States)

    Baker, Jessy L; Jimison, Leslie H; Mannsfeld, Stefan; Volkman, Steven; Yin, Shong; Subramanian, Vivek; Salleo, Alberto; Alivisatos, A Paul; Toney, Michael F

    2010-06-01

    As thin films become increasingly popular (for solar cells, LEDs, microelectronics, batteries), quantitative morphological and crystallographic information is needed to predict and optimize the film's electrical, optical, and mechanical properties. This quantification can be obtained quickly and easily with X-ray diffraction using an area detector in two sample geometries. In this paper, we describe a methodology for constructing complete pole figures for thin films with fiber texture (isotropic in-plane orientation). We demonstrate this technique on semicrystalline polymer films, self-assembled nanoparticle semiconductor films, and randomly packed metallic nanoparticle films. This method can be immediately implemented to help understand the relationship between film processing and microstructure, enabling the development of better and less expensive electronic and optoelectronic devices.

  18. Quantification of thin film crystallographic orientation using X-ray diffraction with an area detector

    Energy Technology Data Exchange (ETDEWEB)

    Baker, Jessica L; Jimison, Leslie H; Mannsfeld, Stefan; Volkman, Steven; Yin, Shong; Subramanian, Vivek; Salleo, Alberto; Alivisatos, A Paul; Toney, Michael F

    2010-02-19

    As thin films become increasingly popular (for solar cells, LEDs, microelectronics, batteries), quantitative morphological information is needed to predict and optimize the film's electronic, optical and mechanical properties. This quantification can be obtained quickly and easily with X-ray diffraction using an area detector and synchrotron radiation in two simple geometries. In this paper, we describe a methodology for constructing complete pole figures for thin films with fiber texture (isotropic in-plane orientation). We demonstrate this technique on semicrystalline polymer films, self-assembled nanoparticle semiconductor films, and randomly-packed metallic nanoparticle films. This method can be immediately implemented to help understand the relationship between film processing and microstructure, enabling the development of better and less expensive electronic and optoelectronic devices.

  19. Thin films and buried interfaces characterization with X-ray standing waves

    Energy Technology Data Exchange (ETDEWEB)

    Lagomarsino, S. [CNR, Rome (Italy). Istituto Elettronica Stato Solido

    1996-09-01

    The X-ray standing wave techniques is a powerful, non destructive method to study interfaces at the atomic level. Its basic features are described here together with the peculiarities of its applications to epitaxial films and buried interfaces. As examples of applications, experiments carried out on Si/silicide interfaces, on GaAs/InAs/GaAs buried interfaces and on Si/Ge superlattices are shown.

  20. Preparation and Application of Chitosan Membranes to Filter Silver from X-ray Film Processing Wastes

    Science.gov (United States)

    Nyoman Rupiasih, N.; Rustam Purnomo, Rendra; Sumadiyasa, Made

    2016-04-01

    Chitosan is a natural polysaccharide biopolymer which has been widely used in different processes and applications. Chitosan based membranes have been used in reverse osmosis, gas separation, dialysis and pervaporation. The object of this research was investigating the possibility of chitosan membrane used as a filter for removing silver (Ag) from X-ray film processing wastes. Several of chitosan membranes such as M1, M2, M3 and M4 have been prepared for the purpose and filtration was done using dead-end filtration method. The filtration experiments were performed on a flat sheet membrane using pure water and X-ray film processing wastes as feeds. The analysis of silver concentration has been done by atomic absorption spectrometers (AAS). The results show that chitosan membrane M2 gave the highest filtration coefficient (Rcoeff ) i.e. 99.9%, with the pure water flux (PWF) and product flux (PF) are 2972.56 L/m2h and 1761.18 L/m2h respectively. The rejection coefficient of the membranes decreases with increasing the amount of chitosan, while the pure water flux and product flux are increased. The filtration coefficients show that the chitosan membranes are able to filter silver waste from X-ray film processing wastes with performance dependent on their characteristic such as pores size. This suggests that, chitosan membrane can be used as one method that is safe and friendly environment for recovering silver from X-ray film processing waste to improve the quality of treated to an acceptable quality level.

  1. Thin film subsurface environments; Advanced X-ray spectroscopies and a novel Bayesian inference modeling algorithm

    Science.gov (United States)

    Church, Jonathan R.

    New condensed matter metrologies are being used to probe ever smaller length scales. In support of the diverse field of materials research synchrotron based spectroscopies provide sub-micron spatial resolutions and a breadth of photon wavelengths for scientific studies. For electronic materials the thinnest layers in a complementary metal-oxide-semiconductor (CMOS) device have been reduced to just a few nanometers. This raises concerns for layer uniformity, complete surface coverage, and interfacial quality. Deposition processes like chemical vapor deposition (CVD) and atomic layer deposition (ALD) have been shown to deposit the needed high-quality films for the requisite thicknesses. However, new materials beget new chemistries and, unfortunately, unwanted side-reactions and by-products. CVD/ALD tools and chemical precursors provided by our collaborators at Air Liquide utilized these new chemistries and films were deposited for which novel spectroscopic characterization methods were used. The second portion of the thesis focuses on fading and decomposing paint pigments in iconic artworks. Efforts have been directed towards understanding the micro-environments causing degradation. Hard X-ray photoelectron spectroscopy (HAXPES) and variable kinetic energy X-ray photoelectron spectroscopy (VKE-XPS) are advanced XPS techniques capable of elucidating both chemical environments and electronic band structures in sub-surface regions of electronic materials. HAXPES has been used to study the electronic band structure in a typical CMOS structure; it will be shown that unexpected band alignments are associated with the presence of electronic charges near a buried interface. Additionally, a computational modeling algorithm, Bayes-Sim, was developed to reconstruct compositional depth profiles (CDP) using VKE-XPS data sets; a subset algorithm also reconstructs CDP from angle-resolved XPS data. Reconstructed CDP produced by Bayes-Sim were most strongly correlated to the real

  2. X-ray absorption near the edge structure and x-ray photoelectron spectroscopy studies on pyrite prepared by thermally sulfurizing iron films

    Institute of Scientific and Technical Information of China (English)

    Zhang Hui; Liu Ying-Shu; Wang Bao-Yi; Wei Long; Kui Re-Xi; Qian Hai-Jie

    2009-01-01

    This paper reports how pyrite films were prepared by thermal sulfurization of magnetron sputtered iron films and characterized by x-ray absorption near edge structure spectra and x-ray photoelectron spectroscopy on a 4B9B beam line at the Beijing Synchrotron Radiation Facility. The band gap of the pyrite agrees well with the optical band gap obtained by a spectrophotometer. The octahedral symmetry of pyrite leads to the splitting of the d orbit into t2g and eg levels. The high spin and low spin states were analysed through the difference of electron exchange interaction and the orbital crystal field. Only when the crystal field splitting is higher than 1.5 eV, the two weak peaks above the white lines can appear, and this was approved by experiments in the present work.

  3. X-ray quantum optics with Moessbauer nuclei in thin-film cavities

    Energy Technology Data Exchange (ETDEWEB)

    Heeg, Kilian Peter

    2014-12-09

    In this thesis thin-film cavities with embedded Moessbauer nuclei probed by near-resonant X-ray light are studied from a quantum optical perspective. A theoretical framework is developed and compact expressions for the observables are derived for the linear excitation regime, which is encountered in current experiments. Even advanced cavity layouts can be modeled in excellent agreement with the results of previous experiments and semi-classical approaches. In the absence of magnetic hyperfine splitting, the spectral response of the system is found to be formed by tunable Fano profiles. An experimental implementation of this line shape control allows to extract spectroscopic signatures with high precision and to reconstruct the phase of the nuclear transition in good agreement with the theoretical predictions. The alignment of medium magnetization and polarization control of the X-rays enable to engineer advanced quantum optical level schemes, in which vacuum induced coherence effects are predicted and successfully demonstrated in an experiment. Furthermore, it is shown that group velocity control for x-ray pulses can be achieved in the cavity. A scheme for its observation is proposed and then employed to experimentally confirm sub-luminal X-ray propagation. Finally, non-linear effects, which could become accessible with future light sources, are explored and a non-linear line shape control mechanism is discussed.

  4. Delayed thermalization of X-rays absorbed in tin films far below the superconducting transition temperature

    Science.gov (United States)

    Stahle, C. K.; Kelley, R. L.; Moseley, S. H.; Szymkowiak, A. E.; Juda, M.; McCammon, D.; Zhang, J.

    1994-02-01

    As part of a program for developing high resolution X-ray detectors, we have deposited 4 μm thick Sn films on silicon calorimeters to serve as X ray absorbers. Thermistors in the silicon measured the temperature increase resulting from the thermalization of an X-ray photon. Silver-filled epoxy was placed on the Sn to establish a complete thermalization reference. The devices were operated near 0.1 K and below. Signal pulses resulting from the absorption of 6 keV photons in the Ag epoxy rose faster, peaked higher, and decayed to baseline more quickly than those resulting from absorption in the Sn. Taking the Ag pulse shape to be the impulse response of the detector, we deconvolved it from the average Sn pulse shape to obtain the thermalization function in the Sn. The result contained a slow component with a thermalization rate on the scale of several milliseconds. We consider this an indication of the quasiparticle recombination time in the Sn during the non-equilibrium condition following X-ray absorption. We were able to manipulate the thermalization by heating the device above the Sn transition temperature and varying the amount of magnetic field present upon cooling.

  5. Influence of structural disorder on soft x-ray optical behavior of NbC thin films

    Energy Technology Data Exchange (ETDEWEB)

    Singh, Amol, E-mail: amolphy@rrcat.gov.in, E-mail: rrcat.amol@gmail.com; Modi, Mohammed H.; Sinha, A. K.; Lodha, G. S. [Indus Synchrotrons Utilization Division, Raja Ramanna Centre for Advanced Technology, Indore 452 013 (India); Rajput, Parasmani [Atomic and Molecular Physics Division, Bhabha Atomic Research Centre, Trombay, Mumbai 400085 (India)

    2015-05-07

    Structural and chemical properties of compound materials are modified, when thin films are formed from bulk materials. To understand these changes, a study was pursued on niobium carbide (NbC) thin films of different thicknesses deposited on Si (100) substrate using ion beam sputtering technique. Optical response of the film was measured in 4–36 nm wavelength region using Indus-1 reflectivity beamline. A discrepancy in soft x-ray performance of NbC film was observed which could not be explained with Henke's tabulated data (see http://henke.lbl.gov/optical{sub c}onstants/ ). In order to understand this, detailed structural and chemical investigations were carried out using x-ray reflectivity, grazing incidence x-ray diffraction, x-ray absorption near edge structure, extended x-ray absorption fine structure, and x-ray photoelectron spectroscopy techniques. It was found that the presence of unreacted carbon and Nb deficiency due to reduced Nb-Nb coordination are responsible for lower soft x-ray reflectivity performance. NbC is an important material for soft x-ray optical devices, hence the structural disorder need to be controlled to achieve the best performances.

  6. Influence of structural disorder on soft x-ray optical behavior of NbC thin films

    Science.gov (United States)

    Singh, Amol; Modi, Mohammed H.; Rajput, Parasmani; Sinha, A. K.; Lodha, G. S.

    2015-05-01

    Structural and chemical properties of compound materials are modified, when thin films are formed from bulk materials. To understand these changes, a study was pursued on niobium carbide (NbC) thin films of different thicknesses deposited on Si (100) substrate using ion beam sputtering technique. Optical response of the film was measured in 4-36 nm wavelength region using Indus-1 reflectivity beamline. A discrepancy in soft x-ray performance of NbC film was observed which could not be explained with Henke's tabulated data (see http://henke.lbl.gov/optical_constants/). In order to understand this, detailed structural and chemical investigations were carried out using x-ray reflectivity, grazing incidence x-ray diffraction, x-ray absorption near edge structure, extended x-ray absorption fine structure, and x-ray photoelectron spectroscopy techniques. It was found that the presence of unreacted carbon and Nb deficiency due to reduced Nb-Nb coordination are responsible for lower soft x-ray reflectivity performance. NbC is an important material for soft x-ray optical devices, hence the structural disorder need to be controlled to achieve the best performances.

  7. Grazing Incidence Small Angle X-Ray Scattering: Technique and Application to Discontinuous Thin Films

    Science.gov (United States)

    Levine, Joanne Rachel

    1990-01-01

    During the early stages of thin film growth in many thin film-substrate systems, adsorbate atoms form discrete three-dimensional islands, typically 10 A to 150 A in size. In order to study these islands, surface sensitive small angle x-ray scattering has been done for the first time by using a grazing incidence geometry (GISAXS). In this method, the substrate is aligned for total external reflection and the islands produce small angle scattering from the refracted beam crossing the substrate surface. The motivation for developing the GISAXS technique is the advantages GISAXS offers. First, because GISAXS works in reflection, there are no substrate thickness restrictions. Second, there is no sample conductivity requirement. Third, there are no x-ray beam induced sample changes. Finally, the x-ray beam samples all of the islands in the beam path simultaneously. In order to examine thin films in situ with GISAXS, an ultra-high vacuum chamber has been built which can be attached to a rotating anode or synchrotron x-ray source. This chamber is equipped with a pair of beryllium windows, a metal evaporator, a sample heater, and a precision rotary sample holder feedthrough. The GISAXS technique was applied to a model system of gold islands on glass substrates. The glass provides high reflectivity and gold provides strong atomic number contrast. For as-deposited films from 5 A to 15 A in average thickness, average island sizes, heights, and preferred island spacings, and the island surface roughness were determined. From the results of low temperature (< 375^circK) post-deposition annealing experiments, a model was developed which explains the observed slow time-dependence of post-deposition island growth in terms of overlapping diffusion fields and mass transfer by island mobility. The activation energy for this process was determined to be 0.49 eV. These GISAXS results were supplemented with transmission electron micrographs of and grazing incidence wide angle x-ray

  8. A study on developpement of guideline on writing technical document for electrical medical devices: Dental x-ray equipment

    Energy Technology Data Exchange (ETDEWEB)

    Lee, Seung Youl; Kim, Jae Ryang; Lee, Jun Ho; Park, Chang Won [Division of Medical Device Research, National Institute of Food and Drug Safety Evaluation, Mnistry of Food and Drug Safety (Korea, Republic of)

    2016-12-15

    Due to recent population aging, the number of check-up for senior citizens has increased steadily. According to this trend, the market size of dental X-ray equipment and the number of approval and review for these devices have simultaneously increased. The technical document of medical device is required for approval and review for medical device, and medical device companies needs to have work comprehension and expertise, as the document needs to include the overall contents such as performances, test criteria, etc.. Yet, since most of domestic manufacturers or importers of medical devices are small businesses, it is difficult for them to recruit professional manpower for approval of medical devices, and submission of inaccurate technical documents has increased. These problems lead to delay of the approval process and to difficulties in quick entering into the market. Especially, the Ministry of Food and Drug safety (MFDS) standards of a dental extra-oral X-ray equipment, a dental intra-oral X-ray equipment, an arm-type computed tomography, and a portable X-ray system have been recently enacted or not. this guideline of dental X-ray equipment adjusting revised standards was developed to help relative companies and reviewers. For this study, first, the methods to write technical document have been reviewed with revised international and domestic regulations and system. Second, the domestic and foreign market status of each item has been surveyed and analyzed. Third, the contents of technical documents already approved by MFDS have been analyzed to select the correct example, test items, criteria, and methods. Finally, the guideline has been developed based on international and domestic regulation, through close review of a consultative body composed of academic, industrial, research institute and government experts.

  9. Thin Film Analysis by X-Ray Scattering Techniques for Structural Characterization

    CERN Document Server

    Birkholz, Mario

    2005-01-01

    With contributions by Paul F. Fewster and Christoph Genzel. While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: w

  10. Normal incidence X-ray standing wave analysis of thin gold films

    Science.gov (United States)

    Satterley, Christopher J.; Lovelock, Kevin R. J.; Thom, Ian; Dhanak, Vinod R.; Buck, Manfred; Jones, Robert G.

    2006-11-01

    Normal incidence X-ray standing wave (NIXSW) analysis has been successfully performed on epitaxial gold films on mica substrates using reflection from the (1 1 1) planes parallel to the surface. We show that NIXSW can be used to monitor the decrease in order within the gold film caused by annealing, and the position of sulfur within a monolayer of methyl thiolate (CH 3S-) on the surface. The Au-S layer spacing was found to be 2.54 ± 0.05 Å, in close agreement with previous work on a single crystal system.

  11. X-ray method for the structural investigation of thin organic films

    Energy Technology Data Exchange (ETDEWEB)

    Rieutord, F.; Benattar, J.J.; Bosio, L.

    1986-07-01

    The structures of thin lamellar films can be determined through a combination of three X-ray experiments using synchrotron radiation. Diffraction experiments in the transmission geometry give the intralamellar ordering, the diffraction at small glancing angles yields the interlamellar organization, and the critical reflection provides the density measurement which is required to obtain the number of structural units per cell. This method is illustrated here with the study of an organic compound deposited in Langmuir-Blodgett films. The compound under study is the complex (N-docosylpyridinium, tetracyano-quino-dimethane TCNQ).

  12. Investigation of structure of PEDOT: PSS thin films using X-ray reflectivity

    Science.gov (United States)

    Kumar, Manoj; Rathi, Sonika; Kumar, Sunil; Vyas, Vimal; Singh, Amarjeet

    2017-05-01

    Thin Films of PEDOT: PSS on the Indium Tin Oxide substrate were prepared at different spinning speed, for instance, 1000 rpm, 1500 rpm, 2000 rpm & 4000 rpm by spin-coating technique. The out-of-plane structure of the thin films was determined by x-ray reflectivity technique to produce electron density profiles, thickness and roughness. High spinning speed (2000 and above) causes segregation of PSS at the top. The overall reduction in electron density of the films indicates that the high electron density component of the film is removed from top along the fluid due to strong centrifugal force at the top. The results bring interesting insight into the structure of PEDOT: PSS films which is likely to influence its current transport properties.

  13. In situ X-ray diffraction studies on the piezoelectric response of PZT thin films

    Energy Technology Data Exchange (ETDEWEB)

    Davydok, A., E-mail: davydok@mpie.de [Aix Marseille Université, CNRS, Université de Toulon, IM2NP UMR 7334, 13397 Marseille (France); Max-Planck-Institut für Eisenforschung, Department Structure and Nano-/Micromechanics of Materials, D-40237 Düsseldorf (Germany); Cornelius, T.W. [Aix Marseille Université, CNRS, Université de Toulon, IM2NP UMR 7334, 13397 Marseille (France); Mocuta, C. [SOLEIL Synchrotron, DiffAbs beamline, L' Orme des Merisiers, Saint-Aubin - BP 48, 91192 Gif-sur-Yvette Cedex (France); Lima, E.C. [Universidade Federal do Tocantins, 77500-000 Porto Nacional, TO (Brazil); Araujo, E.B. [Departamento de Fisica e Quimica, Universidade Estadual Paulista, Av. Brasil, 56 Centro, 15385-000 Ilha Solteira, SP (Brazil); Thomas, O. [Aix Marseille Université, CNRS, Université de Toulon, IM2NP UMR 7334, 13397 Marseille (France)

    2016-03-31

    Piezoelectric properties of randomly oriented self-polarized PbZr{sub 0.50}Ti{sub 0.50}O{sub 3} (PZT) thin films were investigated using in situ synchrotron X-ray diffraction. Possibilities for investigating the piezoelectric effect using micro-sized hard X-ray beams are demonstrated and perspectives for future dynamical measurements on PZT samples with variety of compositions and thicknesses are given. Studies performed on the crystalline [100, 110] directions evidenced piezoelectric anisotropy. The piezoelectric coefficient d{sub 33} was calculated in terms of the lab reference frame (d{sub perp}) and found to be two times larger along the [100] direction than along the [110] direction. The absolute values for the d{sub perp} amount to 120 and 230 pm/V being in good agreement with experimental and theoretical values found in literature for bulk PZT ceramics. - Highlights: • We performed in situ synchrotron X-ray diffraction studies on (PZT) thin films. • We discuss anisotropy of piezo effect in different crystallographic directions. • Perpendicular component Piezo coefficient of thin PZT layer is defined.

  14. Crystallographic analysis of CVD films using x-ray polychromatic radiation

    Energy Technology Data Exchange (ETDEWEB)

    Lavelle, B. [CNRS, Toulouse (France). Centre d`Elaboration de Materiaux et d`Etudes Structurales; Brissonneau, L.; Baggot, E.; Vahlas, C. [INPT-CNRS, Toulouse (France). Lab. Materiaux et Interfaces

    1998-12-31

    The Energy Dispersive X-ray Diffractometry (EDXD) technique was tested for in-situ crystallographic characterization of nickel films processed by chemical vapor deposition (CVD). The diffracted beam at low Bragg angle was analyzed in energy by a solid state detector. A nickel reference sample was used to face the problems of EDXD background signal and uncertainty of sample location. The relative accuracy on lattice parameters measurements is 1.5.10{sup {minus}3}, to be compared to 0.5.10{sup {minus}3} for classical (monochromatic) X-ray diffraction. Texture measurements yields results in agreement with those obtained form recent texture goniometer. Finally, an estimation of the thickness was obtained from the intensity of nickel fluorescence peak. In view of the obtained results, EDXD appears to be a promising technique for in-situ studies. Although less powerful compared to the synchrotron facility, it is more flexible and can be applied at lower cost.

  15. Growth technology, X-ray and optical properties of CdSe thin films

    Energy Technology Data Exchange (ETDEWEB)

    Esparza-Ponce, H.E. [CINVESTAV-IPN Unidad Queretaro, Queretaro 76230, Qro (Mexico); CIMAV, Miguel de Cervantes 120, Chihuahua 31109, Chih. (Mexico)], E-mail: hilda.esparza@cimav.edu.mx; Hernandez-Borja, J. [CINVESTAV-IPN Unidad Queretaro, Queretaro 76230, Qro (Mexico); Reyes-Rojas, A. [CIMAV, Miguel de Cervantes 120, Chihuahua 31109, Chih. (Mexico); Cervantes-Sanchez, M. [CINVESTAV-IPN Unidad Queretaro, Queretaro 76230, Qro (Mexico); Instituto Tecnologico de Morelia, Morelia 58120, Michoacan (Mexico); Vorobiev, Y.V.; Ramirez-Bon, R.; Perez-Robles, J.F. [CINVESTAV-IPN Unidad Queretaro, Queretaro 76230, Qro (Mexico); Gonzalez-Hernandez, J. [CIMAV, Miguel de Cervantes 120, Chihuahua 31109, Chih. (Mexico)

    2009-02-15

    An ammonia-free chemical-bath deposition was used to obtain CdSe thin films on glass substrate. The materials used in the chemical bath were cadmium chloride complexed with sodium citrate and sodium selenosulphate. The preparation conditions, especially the starting solution characteristics, such as concentration of dissolved materials, temperature, pH value as well as deposition time and immersion cycles were optimized to obtain homogeneous stoichiometric films with good adherence to the glass substrate. The films thickness was in the range of 400-500 nm with a growing time of 4 h. The material obtained was characterized by optical absorption, SEM with the energy dispersive X-ray analysis (EDS) and X-ray diffraction. The films obtained at bath temperatures of 70 and 80 deg. C had the hexagonal structure (of wurtzite type), with crystallite size of about 20 nm. Room temperature deposition results in films with the cubic structure and crystallite size of about 4 nm. From optical transmission data, an energy gap equal to 1.88 eV was found. The material is interesting for applications in hybrid systems for solar energy conversion.

  16. Comprehensive X-Ray Diffraction Study of YBa 2Cu 3O 7-δ Thin Films

    Science.gov (United States)

    Moshfegh, A.; Fatollahi, A.; Wang, Y.; Sun, Y.; Hor, P.; Ignatiev, A.

    1995-11-01

    In situ annealed high temperature superconducting YBa2Cu3O7-δ thin films have been deposited on an MgO (100) substrate from a single stoichiometric target using DC magnetron sputtering. The films were characterized by X-Ray diffraction (XRD) and scanning electron microscopy (SEM) techniques. The effect of varying substrate temperature, T s, and O2/Ar ratio on lattice parameters and on the degree of orientation of the films were examined. Both c- and a-lattice parameters decreased with increasing T s. The reduction of c and a-lattice parameters as well as the oxygen deficiency in the films, δ, obey general (T s - T0)-4 behavior. We develope a new method to measure a more accurate way to find the degree of preferrential orientation along c and a-axis of the deposited films, (ΔV006/ΔV200), at different T s by using X-ray diffraction theory and JCPDS files to obtain \\mid {F(006)}/{F(200)}\\mid2. At T s=735°C, the volume fraction along the c-axis was found to be ΔVc≈5.5 ×ΔVa corresponding to 85 grains having preferred orientation along c-axis. In addition, we have also measured FWHM of the (006) and (200) peaks by varying T s. The thickness of the grains were estimated at different substrate temperature using the Scherrer formula.

  17. X-ray analysis and optical properties of nickel oxide thin films

    Energy Technology Data Exchange (ETDEWEB)

    Shaaban, E.R., E-mail: esam_ramadan2008@yahoo.com [Physics Department, Faculty of Science, Al-Azhar University, PO 71452, Assiut (Egypt); Kaid, M.A.; Ali, M.G.S. [Physics Department, Faculty of Science, El-Minia University, El-Minia (Egypt)

    2014-11-15

    Highlights: • A fine NiO powders were prepared by a homogeneous precipitation method. • The microstructure and surface morphology of NiO powder were characterized. • The optical constants and film thicknesses of NiO thin films were obtained by SE. • The change in optical constants and energy gap were interpreted using microstructure parameters. - Abstract: Nanoparticles of NiO were prepared by a homogeneous precipitation method with an aqueous solution of nickel nitrate hexahydrate and citric acid. The microstructure and surface morphology of NiO powder were characterized by thermogravimetric (TGA) analysis, differential scanning calorimeter (DSC), X-ray diffraction (XRD), and infrared (IR) spectroscopy. Different thicknesses of nickel oxide (NiO) thin films were deposited onto highly cleaned glass substrates by the electron beam technique. Their structural characteristics were studied by X-ray diffraction (XRD) and scan electron microscope (SEM). The XRD investigation shows that NiO films are polycrystalline with an cubic type structure. The microstructure parameters, e.g., crystallite size and microstrain were calculated. The optical constants (n, k) and film thicknesses of NiO thin films were obtained by fitting the ellipsometric parameters (ψ and Δ) data using three layer model systems in the wavelength range 300–1100 nm. It is found that the refractive index, n increases with the increase of the film thickness. The possible optical transition in these films is found to be allowed direct transitions. The direct energy gaps increase with increasing of the film thickness.

  18. X-ray photoelectron spectroscopy study of excimer laser treated alumina films

    Science.gov (United States)

    Georgiev, D. G.; Kolev, K.; Laude, L. D.; Mednikarov, B.; Starbov, N.

    1998-01-01

    Amorphous alumina layers are deposited on a single crystal Si substrate by a e-gun evaporation technique. These films are then thermally annealed in oxygen to be crystallized and, further, irradiated with an excimer laser beam. At each stage of the film preparation, an x-ray photoelectron spectroscopy analysis is performed at the film surface and in depth, upon ion beam grinding. Results give evidence for the formation of an aluminosilicate upon thermal annealing of the film in oxygen. At the surface itself, this compound is observed to decompose upon excimer laser irradiation at energy densities exceeding 1.75 J/cm2, giving rise to free Si atoms and SiO2, however with complete disappearance of Al atoms. Model photochemical reactions are proposed to explain such transformations.

  19. In situ X-ray diffraction based investigation of crystallization in solution deposited PZT thin films

    Science.gov (United States)

    Nittala, Krishna

    Solution deposited PZT based thin films have potential applications in embedded decoupling capacitors and pulse discharge capacitors. During solution deposition, precursor solution is deposited onto a substrate to obtain an amorphous film. The film is then crystallized by heating it at a high temperature (˜600 - 700°C). Conditions during the crystallization anneal such as precursor stoichiometry in solution, heating rate and adhesion layer in the substrate are known to influence phase and texture evolution in these films. However, a mechanistic understanding of the changes taking place in these thin films during crystallization is lacking. A better understanding of the crystallization processes in these thin films could enable tailoring the properties of thin films to suit specific applications. To explore the crystallization process in solution deposited PZT thin films, high temperature in situ laboratory and synchrotron X-ray diffraction based techniques were developed. Taking advantage of the high X-ray flux available at synchrotron facilities such as beamline 6-ID-B, Advanced Photon Source, Argonne National Laboratory, crystalline phases formed in the thin films during crystallization at the high heating rates (0.5 -- 60°C/s) typically used during film processing could be measured. Using a 2-D detector for these measurements allowed the simultaneous measurement of both phase and texture information during crystallization. Analytical treatment of the unconventional diffraction geometry used during the synchrotron based measurements was performed to develop methodologies for quantitative estimation of texture components. The nominal lead content in the starting solutions and the heating rate used during crystallization was observed to influence the sequence of phases formed during crystallization of the films. In films crystallized at fast heating rates, titanium segregation, probably due to diffusion of titanium from the adhesion layer, was observed. To

  20. A study of some energy dependent characteristics of X-ray screens used in diagnostic radiology : screen-film sensitivity, MTF and some related factors

    OpenAIRE

    Karlsson, Mikael

    1983-01-01

    Fluorescent x-ray screens are used in medical x-ray diagnostics to absorb x-ray photons and convert these x-ray photons to visible light. The light distribution from these screens are then registered on photographic film to give an x-ray image. Both the sensitivity and the resolution characteristics of these systems are dependent on the x-ray photon energy. To enable a study of these and some other energy dependent characteristics of x-ray screens a number of almost monoener-getic radiation s...

  1. About some practical aspects of X-ray diffraction : From powder to thin film

    Energy Technology Data Exchange (ETDEWEB)

    Valvoda, V. [Charles Univ. Prague (Czech Republic). Faculty of Mathematics and Physics

    1996-09-01

    Structure of thin films can be amorphous, polycrystalline or epitaxial, and the films can be prepared as a single layer films, multilayers or as graded films. A complete structure analysis of thin films by means of X-ray diffraction (XRD) usually needs more than one diffraction geometry to be used. Their principles, advantages and disadvantages will be shortly described, especially with respect to their different sampling depth and different response to orientation of diffracting crystallographic planes. Main differences in structure of thin films with respect to powder samples are given by a singular direction of their growth, by their adhesion to a substrate and often also by a simultaneous bombardment by atomic species during the growth. It means that a thermodynamically unstable atomic structures can be found too. These special features of growth of thin polycrystalline films are reflected in often found strong preferred orientation of grains and in residual stresses conserved in the films. The methods of structure analysis of thin films by XRD will be compared with other techniques which can supply structure images on different scales.

  2. Mapping the spatial and temporal progression of human dental enamel biomineralization using synchrotron X-ray diffraction.

    Science.gov (United States)

    Simmons, Lisa M; Montgomery, Janet; Beaumont, Julia; Davis, Graham R; Al-Jawad, Maisoon

    2013-11-01

    The complex biological, physicochemical process of human dental enamel formation begins in utero and for most teeth takes several years to complete. Lost enamel tissue cannot regenerate, therefore a better understanding of the spatial and temporal progression of mineralization of this tissue is needed in order to design improved in vivo mineral growth processes for regenerative dentistry and allow the possibility to grow a synthetic whole or partial tooth. Human dental enamel samples across a range of developmental stages available through archaeological collections have been used to explore the spatial and temporal progression of enamel biomineralization. Position sensitive synchrotron X-ray diffraction was used to quantify spatial and temporal variations in crystallite organization, lattice parameters and crystallite thickness at three different stages in enamel maturation. In addition X-ray microtomography was used to study mineral content distributions. An inverse correlation was found between the spatial variation in mineral content and the distribution of crystallite organization and thickness as a function of time during enamel maturation. Combined X-ray microtomography and synchrotron X-ray diffraction results show that as enamel matures the mineral content increases and the mineral density distribution becomes more homogeneous. Starting concurrently but proceeding at a slower rate, the enamel crystallites become more oriented and larger; and the crystallite organization becomes spatially more complex and heterogeneous. During the mineralization of human dental enamel, the rate of mineral formation and mineral organization are not identical. Whilst the processes start simultaneously, full mineral content is achieved earlier, and crystallite organization is slower and continues for longer. These findings provide detailed insights into mineral development in human dental enamel which can inform synthetic biomimetic approaches for the benefit of clinical

  3. X-ray reflectivity analysis of titanium dioxide thin films grown by cathodic arc deposition.

    Science.gov (United States)

    Kleiman, A; Lamas, D G; Craievich, A F; Márquez, A

    2014-05-01

    TiO2 thin films deposited by a vacuum arc on a glass substrate were characterized by X-ray reflectivity (XRR), X-ray diffraction (XRD), scanning electron microscopy (SEM) and atomic force microscopy (AFM). Several thin films with different amounts of deposited TiO2 mass and different deposition and annealing temperatures were studied. A qualitative analysis of the XRD patterns indicated the presence of the anatase and/or rutile crystalline phases in most of the studied samples. From the analysis of the experimental XRR curves--which exhibited a wide angular range of oscillatory behavior--the thickness, mass density and interface roughness were determined. All XRR patterns were well fitted by modeled curves that assume the presence of a single and homogeneous TiO2 layer over which a very thin H2O layer is adsorbed. The thickest H2O adsorption layers were developed in films with the highest anatase content. Our overall results of the XRR analyses are consistent with those derived from the imaging techniques (SEM and AFM).

  4. Characterization of thermally evaporated lead iodide films aimed for the detection of X-rays

    Energy Technology Data Exchange (ETDEWEB)

    Caldeira Filho, A.M. [Departamento de Fisica, Faculdade de Filosofia, Ciencias e Letras de Ribeirao Preto, Universidade de Sao Paulo - USP, Avenida Bandeirantes 3900, 14040-901, Ribeirao Preto-SP (Brazil); Mulato, M., E-mail: mmulato@ffclrp.usp.b [Departamento de Fisica, Faculdade de Filosofia, Ciencias e Letras de Ribeirao Preto, Universidade de Sao Paulo - USP, Avenida Bandeirantes 3900, 14040-901, Ribeirao Preto-SP (Brazil)

    2011-04-21

    Some semiconductor materials such as lead iodide (PbI{sub 2}) have applications in the detection of ionizing radiation at room temperature using the direct detection method. In this work we investigate lead iodide films deposited by thermal evaporation. The morphology, structure, and electric properties were investigated as a function of deposition height, i.e. the distance between evaporation-boat and substrates. The results show a morphology of vertical leaves and X-ray diffraction shows just one preferential orientation along the direction 110. Energy dispersive spectroscopy reveals that the films are not stoichiometric, with excess iodine atoms. Electrical resistivity of about 10{sup 8} {Omega} cm was measured. This is smaller than for the bulk due to structural defects. The values of activation energy for electric transport increase from 0.52 up to 1.1 eV with decreasing deposition height, what indicates that the best film is the one deposited at the shortest distance. Exposure under X-ray mammographic energy shows a linear behavior up to 500 mR. No variation in sensibility was observed between 22 and 30 kVp.

  5. Early dental caries detection by method of PNC-diagnostics: comparison with visual and x-ray methods

    Science.gov (United States)

    Masychev, Victor I.; Sokolovsky, Alexander A.; Kesler, Gaby; Alexandrov, Michail T.

    2000-03-01

    In this research results of approbation of the optical PNC- method in dental clinic are presented. The PNC-method was used for diagnostics stages of caries (initial, moderate and deep). The variant of the PNC-method adapted for dental diagnosis is based on simultaneous analyses the following parameters by special algorithms: backscattering and probing radiation, stimulated (endogenous) autofluorescence of caries induced batteries. Analyze of informational signals show good correlation with tooth morphological structure and concentration of anaerobic microflora in hearth of caries lesion. Investigation was performed in vivo on 101 tooth in conditions of typical dental clinic. Comparison of the PNC- method with visual and X-ray ones, which are widely used in clinical practice was made. Preliminary results showed high potential of usage the PNC-method in clinical practice and more high probability of initial caries detection (up to 100%) in comparison with X-ray method (approximately 75%). In cases when X-ray diagnosed absence of initial caries, more sensitive the PNC-method detected initial caries in stage 'white lesion.'

  6. X-ray absorption spectroscopy studies of electrochemically deposited thin oxide films.

    Energy Technology Data Exchange (ETDEWEB)

    Balasubramanian, M.

    1998-06-02

    We have utilized ''in situ'' X-ray Absorption Fine Structure Spectroscopy to investigate the structure and composition of thin oxide films of nickel and iron that have been prepared by electrodeposition on a graphite substrate from aqueous solutions. The films are generally disordered. Structural information has been obtained from the analysis of the data. We also present initial findings on the local structure of heavy metal ions, e.g. Sr and Ce, incorporated into the electrodeposited nickel oxide films. Our results are of importance in a number of technological applications, among them, batteries, fuel cells, electrochromic and ferroelectric materials, corrosion protection, as well as environmental speciation and remediation.

  7. Setup for in situ X-ray diffraction studies of thin film growth by magnetron sputtering

    CERN Document Server

    Ellmer, K; Weiss, V; Rossner, H

    2001-01-01

    A novel method is described for the in situ-investigation of nucleation and growth of thin films during magnetron sputtering. Energy dispersive X-ray diffraction with synchrotron light is used for the structural analysis during film growth. An in situ-magnetron sputtering chamber was constructed and installed at a synchrotron radiation beam line with a bending magnet. The white synchrotron light (1-70 keV) passes the sputtering chamber through Kapton windows and hits one of the substrates on a four-fold sample holder. The diffracted beam, observed under a fixed diffraction angle between 3 deg. and 10 deg., is energy analyzed by a high purity Ge-detector. The in situ-EDXRD setup is demonstrated for the growth of tin-doped indium oxide (ITO) films prepared by reactive magnetron sputtering from a metallic target.

  8. X-Ray Magnetic Circular Dichroism Measurement of Fe-Co Alloy Films Prepared by Electrodeposition

    Institute of Scientific and Technical Information of China (English)

    LI Zong-Mu; XU Fa-Qiang; WANG Li-Wu; WANG Jie; ZHU Jun-Fa; ZHANG Wen-Hua

    2007-01-01

    The macro- and micro-magnetic properties of Fe-Co alloy films eletrodeposited on GaAs(100) are studied by synchrotron radiation x-ray magnetic circular dichroism (XMCD) in combination with the magneto-optical Kerr effect (MOKE) measurements and magnetic force microscopy (MFM). The orbital and spin magnetic moments of each element in the Fe-Co alloy are determined by the sum rules of XMCD. Element-specific hysteresis loops (ESHL) are obtained by recording the La MCD signals as a function of applied magnetic field. MOKE results reveal that the amorphous films are magnetically isotropic in the surface plane. The MFM image shows that the dimension of the magnetic domains is about 1-2 μm, which is much larger than that of the grains, indicating that there are intergranular correlations among these grains. Both ESHL and MOKE hysteresis loops indicate the strong ferromagnetic coupling of Fe and Co in the alloy films.

  9. High energy x-ray diffraction/x-ray fluorescence spectroscopy for high-throughput analysis of composition spread thin films.

    Science.gov (United States)

    Gregoire, John M; Dale, Darren; Kazimirov, Alexander; DiSalvo, Francis J; van Dover, R Bruce

    2009-12-01

    High-throughput crystallography is an important tool in materials research, particularly for the rapid assessment of structure-property relationships. We present a technique for simultaneous acquisition of diffraction images and fluorescence spectra on a continuous composition spread thin film using a 60 keV x-ray source. Subsequent noninteractive data processing provides maps of the diffraction profiles, thin film fiber texture, and composition. Even for highly textured films, our diffraction technique provides detection of diffraction from each family of Bragg reflections, which affords direct comparison of the measured profiles with powder patterns of known phases. These techniques are important for high throughput combinatorial studies as they provide structure and composition maps which may be correlated with performance trends within an inorganic library.

  10. Ordering phenomena in FeCo-films and Fe/Cr-multilayers: an X-ray and neutron scattering study

    Energy Technology Data Exchange (ETDEWEB)

    Nickel, B.

    2001-07-01

    The following topics are covered: critical phenomena in thin films, critical adsorption, finite size scaling, FeCo Ising model, kinematical scattering theory for thin films, FeCo thin films, growth and characterisation of single crystal FeCo thin films, X-ray study of ordering in FeCo films, antiferromagnetic coupling in Fe/Cr multilayers, neutron scattering on Fe/Cr multilayers (WL)

  11. Soft X-Ray Photochemistry of Condensed Mixed Reactants: Thin Film Growth and Ion Desorption

    Science.gov (United States)

    Moore, Jerry Franklin, Jr.

    A novel process for the growth of thin film dielectric materials is presented. By condensing a mixture of reactive compounds onto a surface that is cooled under vacuum, a mixed molecular layer is formed. This layer can then be exposed to soft x-ray radiation to form a refractory thin film of dielectric material. By using either trimethylaluminum (TMA), silane, or tetramethylsilane (TMS) alone or in combination with water or ammonia, it was possible to grow oxide, nitride and carbide films. The growth of these films was generally seen to stop after 30A, and extended exposure to soft x -rays led to decomposition of the films into a more elemental state. The self-limiting growth at 30A was not observed for unmixed systems such as when aluminum carbide was grown from a TMA layer. The explanation for this is that the self-limiting growth is due to excitation of the reaction by substrate electrons, while there are enough electrons generated in the carbide to perpetuate growth indefinitely. Additionally, unlimited growth was observed for TMA and water mixtures excited by ultraviolet radiation (4.6eV). This effect is due to direct photon absorption in the layer that leads to reaction and film growth. Decomposition of the films was observed at extended exposures. It is likely that core excitation is the main cause of this phenomenon. A model that accounts for this decomposition, the relative absorption density of the substrate and the growing film, and the mean free path of the electrons in the film, is presented. The model demonstrates that a limited thickness can be expected when the cross section for film decomposition is significant and the film absorption density is relatively low. Observations of the desorbed ions from the condensed mixtures show that core excitation can lead directly to subsequent reactions. For example, OH^+ was formed from an initial excitation of O _2. The utility of stimulated desorption as a energy dependent probe of these condensed mixed

  12. Hydrodynamic surface fluctuations of polymer films by coherent X-ray scattering

    Energy Technology Data Exchange (ETDEWEB)

    Kim, Hyunjung [Department of Physics and Interdisciplinary Program of Integrated Biotechnology, Sogang University, 1 Shinsu-Dong, Mapo-Gu Seoul 121-742 (Korea, Republic of)]. E-mail: hkim@sogang.ac.kr; Jiang, Zhang [Department of Physics, University of California San Diego, La Jolla, CA 92093 United States (United States); Lee, Heeju [Department of Physics and Interdisciplinary Program of Integrated Biotechnology, Sogang University, 1 Shinsu-Dong, Mapo-Gu Seoul 121-742 (Korea, Republic of); Lee, Young Joo [Department of Physics and Interdisciplinary Program of Integrated Biotechnology, Sogang University, 1 Shinsu-Dong, Mapo-Gu Seoul 121-742 (Korea, Republic of); Jiao, Xuesong; Li, Chunhua [Department of Materials Science and Engineering, SUNY at Stony Brook, Stony Brook, NY 11794 United States (United States); Lurio, Laurence [Department of Physics, Northern Illinois University, De Kalb, IL 60115 United States (United States); Rafailovich, Miriam [Department of Materials Science and Engineering, SUNY at Stony Brook, Stony Brook, NY 11794 United States (United States); Sinha, S.K. [Department of Physics and Interdisciplinary Program of Integrated Biotechnology, Sogang University, 1 Shinsu-Dong, Mapo-Gu Seoul 121-742 (Korea, Republic of); LANSCE, Los Alamos National Laboratory, Los Alamos, NM 87545 United States (United States)

    2007-05-23

    We have applied X-ray photon correlation spectroscopy (XPCS) to measure the surface dynamics of polymer films of thicknesses down to a few times of the polymer radius of gyration. XPCS is currently the only technique to measure selectively dynamics of surface and/or interfacial fluctuations of the films thanks to high brilliance and coherence of the third generation synchrotron source. The results show the behavior of the capillary waves expected in viscous liquid when the film thickness is thicker than four times of the radius of gyration. However, thinner films show a deviation indicating the need to account for viscoelasticity. We present also the theory for surface dynamics of the thermally excited fluctuations on homogenous single-layer film with arbitrary depth is generalized to describe surface and interfacial dynamics of polymeric liquid bilayer films in terms of susceptibilities, power spectra and characteristic relaxation time constants. The effects on surface dynamics originating from viscosity inhomogeneities close to surface region are investigated by the bilayer theory and compared with the surface dynamics from homogeneous single-layer films under non-slip and slip boundary conditions.

  13. Some properties of six different types of dental x-ray unit

    NARCIS (Netherlands)

    Trouerbach, W.Th.; Aken, J. van

    1965-01-01

    Forty-four x-ray machines were tested for reliability of timer and for output. A distinction was made between different types of errors, and large differences between these categories of errors were found.

  14. Low Dose X-Ray Sources and High Quantum Efficiency Sensors: The Next Challenge in Dental Digital Imaging?

    Directory of Open Access Journals (Sweden)

    Arnav R. Mistry

    2014-01-01

    Full Text Available Objective(s. The major challenge encountered to decrease the milliamperes (mA level in X-ray imaging systems is the quantum noise phenomena. This investigation evaluated dose exposure and image resolution of a low dose X-ray imaging (LDXI prototype comprising a low mA X-ray source and a novel microlens-based sensor relative to current imaging technologies. Study Design. A LDXI in static (group 1 and dynamic (group 2 modes was compared to medical fluoroscopy (group 3, digital intraoral radiography (group 4, and CBCT scan (group 5 using a dental phantom. Results. The Mann-Whitney test showed no statistical significance (α=0.01 in dose exposure between groups 1 and 3 and 1 and 4 and timing exposure (seconds between groups 1 and 5 and 2 and 3. Image resolution test showed group 1 > group 4 > group 2 > group 3 > group 5. Conclusions. The LDXI proved the concept for obtaining a high definition image resolution for static and dynamic radiography at lower or similar dose exposure and smaller pixel size, respectively, when compared to current imaging technologies. Lower mA at the X-ray source and high QE at the detector level principles with microlens could be applied to current imaging technologies to considerably reduce dose exposure without compromising image resolution in the near future.

  15. Capability of X-ray diffraction for the study of microstructure of metastable thin films

    Directory of Open Access Journals (Sweden)

    David Rafaja

    2014-11-01

    Full Text Available Metastable phases are often used to design materials with outstanding properties, which cannot be achieved with thermodynamically stable compounds. In many cases, the metastable phases are employed as precursors for controlled formation of nanocomposites. This contribution shows how the microstructure of crystalline metastable phases and the formation of nanocomposites can be concluded from X-ray diffraction experiments by taking advantage of the high sensitivity of X-ray diffraction to macroscopic and microscopic lattice deformations and to the dependence of the lattice deformations on the crystallographic direction. The lattice deformations were determined from the positions and from the widths of the diffraction lines, the dependence of the lattice deformations on the crystallographic direction from the anisotropy of the line shift and the line broadening. As an example of the metastable system, the supersaturated solid solution of titanium nitride and aluminium nitride was investigated, which was prepared in the form of thin films by using cathodic arc evaporation of titanium and aluminium in a nitrogen atmosphere. The microstructure of the (Ti,AlN samples under study was tailored by modifying the [Al]/[Ti] ratio in the thin films and the surface mobility of the deposited species.

  16. X-ray beam monitor made by thin-film CVD single-crystal diamond.

    Science.gov (United States)

    Marinelli, Marco; Milani, E; Prestopino, G; Verona, C; Verona-Rinati, G; Angelone, M; Pillon, M; Kachkanov, V; Tartoni, N; Benetti, M; Cannatà, D; Di Pietrantonio, F

    2012-11-01

    A novel beam position monitor, operated at zero bias voltage, based on high-quality chemical-vapor-deposition single-crystal Schottky diamond for use under intense synchrotron X-ray beams was fabricated and tested. The total thickness of the diamond thin-film beam monitor is about 60 µm. The diamond beam monitor was inserted in the B16 beamline of the Diamond Light Source synchrotron in Harwell (UK). The device was characterized under monochromatic high-flux X-ray beams from 6 to 20 keV and a micro-focused 10 keV beam with a spot size of approximately 2 µm × 3 µm square. Time response, linearity and position sensitivity were investigated. Device response uniformity was measured by a raster scan of the diamond surface with the micro-focused beam. Transmissivity and spectral responsivity versus beam energy were also measured, showing excellent performance of the new thin-film single-crystal diamond beam monitor.

  17. A search for strain gradients in gold thin films on substrates using x-ray diffraction

    Energy Technology Data Exchange (ETDEWEB)

    Leung, O. S. [Department of Materials Science and Engineering, Stanford University, Stanford, California 94305-2205 (United States); Munkholm, A. [Chemistry Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States); Brennan, S. [Stanford Synchrotron Radiation Laboratory, Stanford Linear Accelerator Center, Stanford, California 94309 (United States); Nix, W. D. [Department of Materials Science and Engineering, Stanford University, Stanford, California 94305-2205 (United States)

    2000-08-01

    The high strengths of gold thin films on silicon substrates have been studied with particular reference to the possible effect of strain gradients. Wafer curvature/thermal cycling measurements have been used to study the strengths of unpassivated, oxide-free gold films ranging in thickness from 0.1 to 2.5 {mu}m. Films thinner than about 1 {mu}m in thickness appear to be weakened by diffusional relaxation effects near the free surface and are not good candidates for the study of strain gradient plasticity. Our search for plastically induced strain gradients was thus limited to thicker films with correspondingly larger grain sizes. Three related x-ray diffraction techniques have been used to investigate the elastic strains in these films. The standard d{sub hkl} vs sin2 {psi} technique has been used to find the average strain through the thickness of the films. The results are consistent with wafer curvature measurements. We have also measured a number of d{sub hkl}'s as a function of penetration depth to construct depth-dependent d{sub hkl} vs sin2 {psi} plots. These data show that the residual elastic strain is essentially independent of depth in the film. Finally, a new technique for sample rotation has been used to measure the d{sub hkl}'s for a fixed set of grains in the film as a function of penetration depth. Again, no detectable gradient in strain has been observed. These results show that the high strengths of unpassivated gold films relative to the strength of bulk gold cannot be rationalized on the basis of strain gradients through the film thickness. However, a sharp gradient in strain close to the film substrate interface cannot be ruled out. (c) 2000 American Institute of Physics.

  18. ZnO/ZnAl2O4 Nanocomposite Films Studied by X-Ray Diffraction, FTIR, and X-Ray Photoelectron Spectroscopy

    Directory of Open Access Journals (Sweden)

    S. Iaiche

    2015-01-01

    Full Text Available ZnO/ZnAl2O4 nanocomposite films were synthesised by ultrasonic spray pyrolysis (USP by extracting Al2O(SO42 oxide with zinc chloride hydrate in deionised water. The sample was then subjected to heat treatment at 650°C and 700°C for 1 h, which led to the formation of the spinel oxide (ZnAl2O4 and wurtzite (ZnO phases. Al2(SO43·18H2O salt was transformed into aluminum oxide sulfate Al2O(SO42, which is an intermediary decomposition product, by calcination at 795°C for 3 h. The structures of the synthesised ZnO/ZnAl2O4 films were confirmed by XRD, FTIR, and X-ray photoelectron spectroscopy (XPS. XPS spectra of the major Zn, Al, and O photoelectron lines and the major X-ray induced Zn LMM Auger lines for ZnO/ZnAl2O4 are presented.

  19. X-ray reflectivity investigation of the foam bilayer film formed by hexaethylene glycol dodecyl ether

    Institute of Scientific and Technical Information of China (English)

    SHEN Qiang; J. J. Benattar; LI Xin; LIU Shaojie

    2003-01-01

    Structural parameters for the free-standing foam film of hexaethylene glycol monododecyl ether (C12E6) have been measured by using X-ray reflectometry. The results indicate that a "five-laminae" model corresponds to this inverted bilayer and divides it into five regions. The thicknesses of the aliphatic chainregions, the polar head-group regions, and the central aqueous core are 0.90, 1.35 and 1.31 nm, respectively; and their corresponding electron densities are 2.4 ( 10?3, 2.6 ( 10?3 and 2.3(10?3 electron/nm3, respectively; the interfacial roughness between adjacent regions is 0.34 nm. The central core of this foam film does not contain free water, its thickness decreased 0.40 nm under the irradiation of infrared rays due to the loss of structural water.

  20. Superconductivity and x-ray photoemission study of MgB2 thin films

    Institute of Scientific and Technical Information of China (English)

    王淑芳; 周岳亮; 朱亚彬; 张芹; 谢侃; 陈正豪; 吕惠宾; 杨国桢

    2002-01-01

    Highly c-axis oriented MgB2 thin films with Tconset of 39.6K were fabricated by magnesium diffusing into pulsed-laser-deposited boron precursors. The estimation of critical current density Jc, using hysteresis loops and the Bean model, has given the value of 107A/cm2 (15K, 0T), which is one of the highest values ever reported. The x-ray photoemission study of the MgB2 thin films has revealed that the binding energies of Mg 2p and B 1s are at 49.4eV and 186.9eV, which are close to those of metallic Mg and transition-metal diborides, respectively.

  1. X-ray reflectivity study of bias graded diamond like carbon film synthesized by ECR plasma

    Indian Academy of Sciences (India)

    R M Dey; S K Deshpande; S B Singh; N Chand; D S Patil; S K Kulkarni

    2013-02-01

    Diamond like carbon (DLC) coatings were deposited on silicon substrates by microwave electron cyclotron resonance (ECR) plasma CVD process using plasma of Ar and CH4 gases under the influence of negative d.c. self bias generated on the substrates by application of RF (13.56 MHz) power. The negative bias voltage was varied from −60 V to −150 V during deposition of DLC films on Si substrate. Detailed X-ray reflectivity (XRR) study was carried out to find out film properties like surface roughness, thickness and density of the films as a function of variation of negative bias voltage. The study shows that the DLC films constituted of composite layer i.e. the upper sub surface layer followed by denser bottom layer representing the bulk of the film. The upper layer is relatively thinner as compared to the bottom layer. The XRR study was an attempt to substantiate the sub-plantation model for DLC film growth.

  2. X-ray and transmission electron microscopy structural characterization of multifunctional Perovskite thin films

    Energy Technology Data Exchange (ETDEWEB)

    Boudard, M., E-mail: Michel.Boudard@grenoble-inp.fr [Laboratoire des Materiaux et du Genie Physique, Grenoble INP, CNRS(UMR 5628), MINATEC, 3 parvis Louis Neel, BP 257, 38016 Grenoble Cedex 1 (France); Girardot, C. [Laboratoire des Materiaux et du Genie Physique, Grenoble INP, CNRS(UMR 5628), MINATEC, 3 parvis Louis Neel, BP 257, 38016 Grenoble Cedex 1 (France); Schneider Electric Industries S.A.S., 37 Quai Paul Louis Merlin, 38050 Grenoble Cedex 9 (France); Ihzaz, N. [Laboratoire des Materiaux et du Genie Physique, Grenoble INP, CNRS(UMR 5628), MINATEC, 3 parvis Louis Neel, BP 257, 38016 Grenoble Cedex 1 (France); Laboratoire de Physico-Chimie des Materiaux, Departement de Physique, Faculte des Sciences de Monastir, 5019 Monastir, Universite de Monastir (Tunisia); Pignard, S.; Rapenne, L.; Roussel, H. [Laboratoire des Materiaux et du Genie Physique, Grenoble INP, CNRS(UMR 5628), MINATEC, 3 parvis Louis Neel, BP 257, 38016 Grenoble Cedex 1 (France); Bartasyte, A. [Laboratoire des Materiaux et du Genie Physique, Grenoble INP, CNRS(UMR 5628), MINATEC, 3 parvis Louis Neel, BP 257, 38016 Grenoble Cedex 1 (France); P2M, Institut Jean Lamour, Nancy Universite, Bd. des Aiguillettes, 54506 Vandoeuvre-ls-Nancy cedex (France)

    2012-05-01

    Different multifunctional (PbTiO{sub 3}, Sm{sub 0.6}Nd{sub 0.4}NiO{sub 3}, NdMnO{sub 3}) thin films were grown by metalorganic chemical vapor deposition (MOCVD) technique on SrTiO{sub 3} and LaAlO{sub 3} substrates. Transmission electron microscopy (TEM) and X-ray diffraction measurements reveal that almost single crystalline thin films can be epitaxially grown on the top of substrates. The relationship between the crystallographic orientation of the films and those of the substrates were determined by reciprocal space mapping and TEM analyses. PbTi03 thin films appear to be under tensile or compressive strain according to the different mismatch of their cell parameter with those of the substrate. Relaxation mechanism as a function of the film thickness arises from coexistence of different type of domains and size and strain effect are analyzed. SmNiO{sub 3} thin films present diffuse scattering strikes and are less well organized when compared to PbTi0{sub 3} thin films. Different domains are observed as well as an additional parasitic phase close to NiO. Its regular distribution can be associated to reduced transport properties. Preliminary observations on NdMnO{sub 3} thin films shows that an amorphous phase is obtained during MOCVD that can be transformed in a single crystalline film by annealing. The films are under tensile or compressive strain according to the different mismatch of their cell parameter with those of the substrate. Magnetic properties are investigated.

  3. Exposure to ionizing radiation during dental X-rays is not associated with risk of developing meningioma: a meta-analysis based on seven case-control studies.

    Directory of Open Access Journals (Sweden)

    Ping Xu

    Full Text Available Many observational studies have found that exposure to dental X-rays is associated with the risk of development of meningioma. However, these findings are inconsistent. We conducted a meta-analysis to assess the relationship between exposure to dental X-rays and the risk of development of meningioma.The PubMed and EMBASE databases were searched to identify eligible studies. Summary odds ratio (OR estimates and 95% confidence intervals (95% CIs were used to compute the risk of meningioma development according to heterogeneity. Subgroup and sensitivity analyses were performed to further explore the potential heterogeneity. Finally, publication bias was assessed.Seven case-control studies involving 6,174 patients and 19,459 controls were included in the meta-analysis. Neither exposure to dental X-rays nor performance of full-mouth panorex X-rays was associated with an increased risk of development of meningioma (overall: OR, 0.97; 95% CI, 0.70-1.32; dental X-rays: OR, 1.05; 95% CI, 0.89-1.25; panorex X-rays: OR, 1.01; 95% CI, 0.76-1.34. However, exposure to bitewing X-rays was associated with a slightly increased risk of development of meningioma (OR, 1.73; 95% CI, 1.28-2.34. Similar results were obtained in the subgroup and sensitivity analyses. Little evidence of publication bias was observed.Based on the currently limited data, there is no association between exposure to dental X-rays and the risk of development of meningioma. However, these results should be cautiously interpreted because of the heterogeneity among studies. Additional large, high-quality clinical trials are needed to evaluate the association between exposure to dental X-rays and the risk of development of meningioma.

  4. The Characteristics and Dynamic Changes of X-Ray Chest Film in 50 Patients with Severe Acute Respiratory Syndrome

    Institute of Scientific and Technical Information of China (English)

    马俊义; 李智岗; 赵增毅; 孙武装; 王颖

    2003-01-01

    @@ Severe acute respiratory syndrome (SARS) is a new acute infectious disease which quickly spreads and develops, resulting in high mortality. Since there lacks any diagnostic method with high specificity and sensitivity, the X-ray chest film becomes an important measure for diagnosis for SARS. Therefore, to understand the characteristics of X-ray chest film in SARS patients and get to know the rule of its dynamic changes is meaningful for SARS diagnosing, treating and prognosing. The characteristics and dynamic changes of chest film in 50 SARS patients in Hebei Province were analysed by the authors and reported as follows.

  5. Soft-X-ray magnetic circular dichroism : a new technique for probing magnetic properties of magnetic surfaces and ultrathin films

    NARCIS (Netherlands)

    Tjeng, L.H.; Idzerda, Y.U.; Rudolf, P.; Sette, F.; Chen, C.T.

    1992-01-01

    We demonstrate the feasibility of applying the novel soft-X-ray magnetic circular dichroism (SXMCD) technique to investigate the magnetic properties of magnetic surfaces and uitrathin films. Measurements have been carried out on Ni films of various thickness on a Cu(100) substrate at the Ni L2,3 abs

  6. Comparative review of computed tomography of the spinal column and conventional x-ray films

    Energy Technology Data Exchange (ETDEWEB)

    Shin, H.; Yamaura, A.; Horie, T.; Makino, H. (Chiba Univ. (Japan). School of Medicine)

    1982-04-01

    Computerized tomography (CT) of the cervical spinal column was carried out in 39 patients using a GE.CT/T or Toshiba TCT60A scanner. There were 22 cervical disk lesions, 4 spinal neoplasms, 5 narrow spinal canals with or without ossification of the posterior longitudinal ligament, 2 syringomyelias, 5 traumas, and one Arnold-Chiari malformation. In all the patients, tomography was done after conventional spinal X-ray studies. The correlation between the CT findings and conventional X-ray films revealed the excellent capability of the CT. The measurement of the midline sagittal diameter of the spinal canal in the patient with the narrowest canal in this series showed 7.4 mm when done by CT and 9.6 mm when done by the conventional plain film at the C/sub 5/ level. To ascertain the precise sagittal diameter of the cord itself, CT myelography is indispensable after the intrathecal injection of metrizamide A; metrizamide CT myelogram is useful in determining the nature of the disease, the risk of and best approach to surgery, and the evaluation after a surgical procedure. Although the range of motion of cervical joints and intervertebral foramen are visible with the conventional films, the size of the spinal tumors, the degree of bony change, and the tumor extension to the paraspinal connective tissue can be precisely demonstrated only by CT. A CT study of the spine is a simple procedure and is less likely to produce complication, even with a metrizamide CT myelogram, though there are certain limitations in the examination.

  7. Design of hybrid sol gel films for direct x-ray and electron beam nanopatterning

    Science.gov (United States)

    Brusatin, Giovanna; Della Giustina, Gioia; Romanato, Filippo; Guglielmi, Massimo

    2008-04-01

    New epoxy based sol-gel organic inorganic materials, showing lithographic resist-like properties without the addition of any photocatalysts, are presented. To obtain a material sensitive to radiation, specific sol-gel syntheses based on an organically modified alkoxide containing an epoxy ring, 3-glycidoxypropyltrimethoxysilane (GPTMS), have been developed. The synthesis and the patternability of hybrid materials have been obtained controlling the inorganic crosslinking degree and with an almost total absence of organic polymerization. Two examples of directly patternable hybrid films, called GB and GGe, have been synthesized using acidic (GGe) and basic (GB) conditions and obtaining different compositions. After electron beam lithography (EBL) or x-ray synchrotron radiation lithography (XRL) the polymerization of the organic component of the sol-gel film occurs, generating a hardening of the structure after post-exposure baking. The exposed polymerized material becomes insoluble, determining a negative resist-like behaviour of the film: the lithographic process of nanopatterning results from the dissolution of the unexposed areas in proper solvents (developers). Spatial resolution of the order of 200 nm is reported and a contrast of 2.2 is achieved. The novelty of this work is that epoxy based materials, which have enhanced thermomechanical stability with respect to the more usual acrylic based resins, are directly nanopatterned for the first time by electron beam (EB) and/or x-ray beam radiation exposure without the aid of catalysts for polymerization. In contrast to common resists that are sacrificial layers of the fabrication process, direct patternable sol-gel hybrids constitute the final material of the devices. In fact, an example of doping with a light emitting dye is reported together with the achievement of directly patterned structures by EBL and XRL.

  8. Crystallographic origin of perpendicular magnetic anisotropy in CoPt film: polarized x-ray absorption study

    Energy Technology Data Exchange (ETDEWEB)

    Pandey, K [National University of Singapore; Chen, J [National University of Singapore; Liu, T [Oak Ridge National Laboratory (ORNL); Sun, C [Singapore Synchrotron Light Source; Chow, G [National University of Singapore

    2009-01-01

    Crystallographic structure, growth induced miscibility gap and strain in Ta/Co100 xPtx (0 x 43 at%)/Ru/Ta/glass films deposited at ambient temperature were investigated using polarized x-ray absorption spectroscopy to clarify the origin of observed perpendicular magnetic anisotropy (PMA) in Co72Pt28 film. Extended x-ray absorption fine structure spectroscopy data at Co K-edge showed that Co has a similar local atomic environment and averaged interatomic distance in the in-plane and out-of-plane polarization geometries for Co72Pt28, ruling out the contribution of magneto-elastic anisotropy and growth induced structural anisotropy as the origin of PMA. A large PMA in Co72Pt28 film was attributed to the preferred hexagonal close-packed stacking as observed using the x-ray absorption near-edge structure spectroscopy.

  9. Theoretical modelling of X-ray production in thin films characterization with electron probe: Invariant embedding results

    CERN Document Server

    Heluani, S P

    2002-01-01

    Employing the invariant embedding principle, theoretical expressions for the detected characteristic X-ray intensities generated in electron probe microanalysis of thin films are obtained. Characteristic X-ray emission from the elements present in a solid is calculated from the probabilities of the backscattered and transmitted electron trajectories within the film and the substrate. The theoretical expressions mentioned provide for the possibility of developing procedures for microanalysis directly from the experimental results without making approaches for the estimation of the phi(rho z) function. The procedure used permits to calculate the recorded X-rays as a function of incident beam voltage and also as a function of the sample thickness. The method presented here gives the possibility of obtaining calibration curves for thin films and multi-layers. The results obtained are found to agree with experimental ones.

  10. Detection of early stages of dental caries by optical PNC diagnostics: comparison with visual inspection, dental probe, and x-ray methods

    Science.gov (United States)

    Masychev, Victor I.; Sokolovsky, Alexander A.; Kesler, Gaby

    2000-11-01

    In this research results of approbation of the optical PNC-method in dental clinic are presented. The PNC-method was used for diagnostics stages of caries (initial, moderate and deep). The variant of the PNC-method adapted for dental diagnosis is based on simultaneous analyses the following parameters by special algorithms: probing radiation, stimulated backscattering and autofluorescence of caries induced batteries. Analyze of informational signals show good correlation with tooth morphological structure and concentration of anaerobic microflora in hearth of caries lesion. Investigation was performed in vivo on 101 tooth in conditions of typical dental clinic. Comparison of the PNC-methods with visual inspection, dental probe and X-ray ones, which are widely used in clinical practice was made. Preliminary results showed high potential of usage of the PNC-method in clinical practice and more high probability of initial caries detection (up to 100%) in comparison with X-ray method (approximately 75%). In cases when X-ray diagnosed absence of initial caries, more sensitive the PNC-method detected initial caries in stage white lesion.

  11. Infrared Spectroscopic, X-ray and Nanoscale Characterization of Strontium Titanate Thin Films

    Energy Technology Data Exchange (ETDEWEB)

    Webb, J. D.; Moutinho, H. R.; Kazmerski, L. L.; Mueller, C. H.; Rivkin, T. V.; Treece, R. E.; Dalberth, M.; Rogers, C. T.

    1997-01-01

    Attenuated total reflectance (ATR) measurements were performed using Fourier transform infrared (FTIR) spectroscopy in the ATR mode with a thallium iodobromide (KRS-5) crystal to measure the frequencies of the v{sub 3} and v{sub 4} phonon absorption bands in thin strontium titanate films deposited on single-crystal yttrium-barium copper oxide (YBCO), lanthanum aluminate, magnesium oxide, and strontium titanate substrates. The KRS-5 crystal enabled FTIR-ATR measurements to be made at frequencies above 400 cm-1. Atomic force microscopy (AFM) and X-ray diffraction (XRD) measurements were also made to further characterize the films. The measurements were repeated on single-crystal specimens of strontium titanate and the substrates for comparison. Softening in the frequency of the v{sub 4} transverse optical phonon in the lattice-mismatched films below the established value of 544 cm-1 is indicative of the highly textured, polycrystalline ceramic nature of the films and is consistent with the XRD and AFM results.

  12. Infrared spectroscopic, x-ray, and nanoscale characterization of strontium titanate thin films

    Energy Technology Data Exchange (ETDEWEB)

    Webb, J D; Moutinho, H R; Kazmerski, L L [National Renewable Energy Lab., Golden, CO (United States); Mueller, C H; Rivkin, T V; Treece, R E [Superconducting Core Technologies, Inc., Golden, CO (United States); Dalberth, M; Rogers, C T [Colorado Univ., Boulder, CO (United States). Dept. of Physics

    1996-06-01

    Attenuated total reflectance (ATR) measurements were performed using Fourier transform infrared (FTIR) spectroscopy in the ATR mode with a thallium iodobromide (KRS-5) crystal to measure the frequencies of the v{sub 3} and v{sub 4} phonon absorption bands in thin Sr titanate films deposited on single-crystal Y-Ba Cu oxide (YBCO), La aluminate, Mg oxide, and Sr titanate substrates. The KRS-5 crystal enabled FTIR-ATR measurements at frequencies above 400 cm{sup -1}. Atomic force microscopy (AFM) and x-ray diffraction (XRD) measurements were also made to further characterize the films. The measurements were repeated on single-crystal specimens of Sr titanate and the substrates for comparison. Softening in the frequency of the v{sub 4} transverse optical phonon in the lattice-mismatched films below the established value of 544 cm{sup -1} is indicative of the highly textured, polycrystalline ceramic nature of the films and is consistent with the XRD and AFM results.

  13. Infrared spectroscopic, x-ray, and nanoscale characterization of strontium titanate thin films

    Energy Technology Data Exchange (ETDEWEB)

    Webb, J.D.; Moutinho, H.R.; Kazmerski, L.L. [National Renewable Energy Lab., Golden, CO (United States); Mueller, C.H.; Rivkin, T.V.; Treece, R.E. [Superconducting Core Technologies, Inc., Golden, CO (United States); Dalberth, M.; Rogers, C.T. [Colorado Univ., Boulder, CO (United States). Dept. of Physics

    1996-04-01

    Attenuated total reflectance (ATR) measurements were performed using Fourier transform infrared (FTIR) spectroscopy in the ATR mode with a thallium iodobromide (KRS-5) crystal to measure the frequencies of the {nu}{sub 3} and {nu}{sub 4} phonon absorption bands in thin strontium titanate films deposited on single-crystal yttrium-barium copper oxide (YBCO), lanthanum aluminate, magnesium oxide, and strontium titanate substrates. The KRS-5 crystal enabled FTIR-ATR measurements to be made at frequencies above 400 cm{sup {minus}1}. Atomic force microscopy (AFM) and X-ray diffraction (XRD) measurements were also made to further characterize the films. The measurements were repeated on single-crystal specimens of strontium titanate and the substrates for comparison. Softening in the frequency of the {nu}{sub 4} transverse optical phonon in the lattice- mismatched films below the established value of 544 cm{sup {minus}1} is indicative of the highly textured, polycrystalline ceramic nature of the films and is consistent with the XRD and AFM results.

  14. Structural investigations of complex perovskite oxide films with X-ray diffraction

    Energy Technology Data Exchange (ETDEWEB)

    Boldyreva, Ksenia; Rata, Diana; Herklotz, Andreas; Bilani-Zeneli, Orkidia; Huehne, Ruben; Schultz, Ludwig; Doerr, Kathrin [IFW Dresden (Germany)

    2009-07-01

    The electronic and magnetic properties of many complex oxides are highly sensitive to external parameters which include mechanical deformation or strain. Thus, X-ray diffraction methods such as reciprocal space mapping are powerful and indispensable for the characterization of thin films, particularly for evaluating the in-plane strain state. The direct influence of strain on the magnetization of epitaxial La{sub 1-x}Sr{sub x}MnO{sub 3} (LSMO) films has been studied utilizing piezoelectric PMN-PT substrates. On the other hand, La{sub 1-x}Sr{sub x}CoO{sub 3} (LSCO) films also reveal large strain-induced changes of the magnetization and the electrical conductivity. Since the in-plane lattice parameter of the piezoelectric substrate, PMN-PT, of {proportional_to}4.02A is larger than that of most correlated oxides, LaSc{sub 1-x}Al{sub x}O{sub 3} (LSAO) has been explored as a buffer layer showing a lattice parameter that is tunable by the composition x. The lattice structure of (i) LSAO buffers depending on the composition and (ii) of magnetic films (LSMO, LSCO) grown in various strain states is discussed.

  15. CHARACTERIZATION OF POLYCRYSTALLINE GRADIENT THIN FILM BY X-RAY DIFFRACTION METHOD

    Institute of Scientific and Technical Information of China (English)

    LI BIN; TAO KUN; LIU XING-TAO; MIAO WEI; FENG TAO; YANG NING; LIU BAI-XIN

    2000-01-01

    A direct method is proposed to quantitatively characterize the structural depth profiles emerged in the polycrystalline thin films based on the information obtained by X-ray diffraction (XRD) with various incident angles and treated by a numerical procedure known as the constrained linear inversion. It should be noted that the proposed method was neither sensitive to the random noise appearing in experiment nor to the error originated from the measured thickness of the specimen. To testify the validity of the method, XRD measurements were carried out on a specially designed Pd/Ag bilayer sample, which was annealed at 490 ℃ for 20min, and the depth profiles were accordingly calculated through resolving the obtained XRD patterns. The elemental concentration depth profile of the Pd/Ag bilayer sample was in turn calculated from the resolved patterns, which was in good agreement with those obtained by Auger electron analysis on the annealed sample.

  16. The Rh oxide ultrathin film on Rh(100): an x-ray photoelectron diffraction study.

    Science.gov (United States)

    Zhan, Rong Rong; Vesselli, Erik; Baraldi, Alessandro; Lizzit, Silvano; Comelli, Giovanni

    2010-12-07

    The surface and interface structure of the RhO(2) ultrathin film grown on Rh(100) is investigated by means of x-ray photoelectron diffraction. Experimental and simulated one- and two-dimensional angular distribution intensities of the O1s and Rh3d(5/2) chemically shifted core levels are quantitatively analyzed. The previously proposed O-Rh-O trilayer model is independently confirmed. A rippled buckling of the metal surface is observed at the oxide-metal interface, with a mean interfacial Rh-O distance which is 0.2 Å larger with respect to previous findings. The link between the local atomic rearrangement and the overall geometric and electronic properties of the oxide is discussed on the basis of a thorough comparison with the corresponding RhO(2) rutile structure.

  17. In-Situ Synchrotron X-ray Study of the Phase and Texture Evolution of Ceria and Superconductor Films Deposited by Chemical Solution Method

    DEFF Research Database (Denmark)

    Yue, Zhao; Grivel, Jean-Claude; He, Dong

    2012-01-01

    In situ synchrotron x-ray diffraction is used to study the phase and texture formation of ceria based films and superconductor films deposited by the chemical solution method on technical substrates. Combined analysis using in situ synchrotron x-ray diffraction, thermogravimetry/differential ther......In situ synchrotron x-ray diffraction is used to study the phase and texture formation of ceria based films and superconductor films deposited by the chemical solution method on technical substrates. Combined analysis using in situ synchrotron x-ray diffraction, thermogravimetry...

  18. Update of diagnostic medical and dental x-ray exposures in Romania

    Energy Technology Data Exchange (ETDEWEB)

    Sorop, Ioana; Mossang, Daniela; Dadulescu, Elena [Radiation Hygiene Laboratory of Public Health Authority Dolj, 2, Constantin Lecca Street, Craiova (Romania); Iacob, Mihai Radu [University ' Alexandru Ioan Cuza' , 11, Carol I Street, 700506, Iasi (Romania); Iacob, Olga [Institute of Public Health, 14, Victor Babes Street, 700465 Iasi (Romania)], E-mail: danamossang@sanpubdj.ro

    2008-12-15

    This national study, the third in the last 15 years, updates the magnitude of medical radiation exposure from conventional x-ray examinations, in order to optimise the radiological protection to the population in a cost-effective manner. Effective doses from diagnostic radiology were estimated for adult and paediatric patients undergoing the 20 most important types of x-ray examination. Data were collected from 179 x-ray departments, selected by their annual workload, throughout the country. Estimates were made using two dosimetric quantities: entrance surface dose, derived from the absorbed dose in air measured by simulation of radiographic examinations, and dose-area product, measured during fluoroscopic examinations performed on adult and paediatric patients. Conversion coefficients to effective dose of the UK National Radiological Protection Board (NRPB) have been used in all calculations. The effective dose per patient from all medical x-ray examinations was 0.74 mSv and the resulting annual collective effective dose was 6930 man Sv, with annual effective dose per caput of 0.33 mSv. The current size of population exposure from diagnostic radiology is lower than the previous one by 40%, but could be about 30% higher by taking into account the estimated contribution from computed tomography (CT) procedures.

  19. Study of texture effect on elastic properties of Au thin films by x-ray diffraction and Brillouin light scattering

    Energy Technology Data Exchange (ETDEWEB)

    Faurie, D [LPMTM, UPR 9001 CNRS, Universite Paris-Nord, 93430 Villetaneuse (France); Djemia, P [LPMTM, UPR 9001 CNRS, Universite Paris-Nord, 93430 Villetaneuse (France); Renault, P-O [LMP, UMR 6630 CNRS, Universite de Poitiers, 86962 Futuroscope (France); Roussigne, Y [LPMTM, UPR 9001 CNRS, Universite Paris-Nord, 93430 Villetaneuse (France); Cherif, S M [LPMTM, UPR 9001 CNRS, Universite Paris-Nord, 93430 Villetaneuse (France); Bourhis, E Le [LMP, UMR 6630 CNRS, Universite de Poitiers, 86962 Futuroscope (France); Goudeau, Ph [LMP, UMR 6630 CNRS, Universite de Poitiers, 86962 Futuroscope (France)

    2007-12-15

    We have shown a strong texture effect on elastic properties of gold thin films deposited by physical vapour deposition. Elastic properties of non-textured and {l_brace}111{r_brace} fiber textured gold thin films were investigated by x-ray diffraction combined with in-situ tensile testing and Brillouin light scattering. These static and dynamic methods allowed characterizing the local and macroscopic elastic behavior of gold films.

  20. Characterization of r.f. sputtered thin Mo, W and Si films as precursors to multilayer X-ray mirrors

    Science.gov (United States)

    Bhattacharyya, D.; Joseph, D.; Poswal, A. K.

    2006-08-01

    Single layers of Mo, W and Si thin films have been deposited by r.f. sputtering on float glass and c-Si substrates kept at room temperature. The films have been characterised by grazing incidence X-ray reflectometry (GIXR), X-ray transmission (XRT), Rutherford backscattering spectrometry (RBS), atomic force microscopy (AFM) and phase modulated spectroscopic ellipsometry (SE) studies. The thickness values obtained from the GIXR measurements have been used to calibrate the in situ thickness monitors. The surface roughness of the thin layers have also been determined from the GIXR measurements. The atomic mass density in the films have been obtained from the RBS measurements while X-ray absorption has been estimated from the XRT measurements. The surface morphology of the films has been investigated by the AFM micrographs. The Si thin films have also been characterized by the SE technique. The characterization of the samples by these complementary techniques have been very useful in optimizing the process parameters to obtain good quality layers as precursors to the fabrication of the multilayer X-ray mirrors based on Mo/Si and W/Si structures.

  1. Structural and X-Ray Photoelectron Spectroscopy Study of Al-Doped Zinc-Oxide Thin Films

    Directory of Open Access Journals (Sweden)

    Bong Ju Lee

    2015-01-01

    Full Text Available Al-doped zinc-oxide (AZO thin films were prepared by RF magnetron sputtering at different oxygen partial pressures and substrate temperatures. The charge-carrier concentrations in the films decreased from 1.69 × 1021 to 6.16 × 1017 cm−3 with increased gas flow rate from 7 to 21 sccm. The X-ray diffraction (XRD patterns show that the (002/(103 peak-intensity ratio decreased as the gas flow rate increased, which was related to the increase of AZO thin film disorder. X-ray photoelectron spectra (XPS of the O1s were decomposed into metal oxide component (peak A and the adsorbed molecular oxygen on thin films (peak B. The area ratio of XPS peaks (A/B was clearly related to the stoichiometry of AZO films; that is, the higher value of A/B showed the higher stoichiometric properties.

  2. Structural analysis of polymer thin films using GISAXS in the tender X-ray region: Concept and design of GISAXS experiments using the tender X-ray energy at BL-15A2 at the Photon Factory

    Energy Technology Data Exchange (ETDEWEB)

    Takagi, H., E-mail: takagih@post.kek.jp; Igarashi, N.; Mori, T.; Saijo, S.; Nagatani, Y.; Shimizu, N. [Photon Factory, Institute of Materials Structure Science, High Energy Accelerator Research Organization, 1-1 Oho, Tsukuba, Ibaraki 305-0801 (Japan); Ohta, H. [Mitsubishi Electric System & Service Co., Ltd, Accelerator Engineering Center, 2-8- 8 Umezono, Tsukuba, Ibaraki 305-0045 (Japan); Yamamoto, K. [Graduate School of Engineering, Department of Materials Science & Technology, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466-8555 (Japan)

    2016-10-14

    If small angle X-ray scattering (SAXS) utilizing the soft X-ray region is available, advanced and unique experiments, which differ from traditional SAXS methods, can be realized. For example, grazing-incidence small angle X-ray scattering (GISAXS) using hard X-ray is a powerful tool for understanding the nanostructure in both vertical and lateral directions of thin films, while GISAXS utilizing the tender X-ray region (SX-GISAXS) enables depth-resolved analysis as well as a standard GISAXS analysis in thin films. Thus, at BL-15A2 at the Photon Factory, a dedicated diffractometer for SX-GISAXS (above 2.1 keV) was constructed. This diffractometer is composed of four vacuum chambers and can be converted into the vacuum state from the sample chamber in front of the detector surface. Diffractions are clearly observed until 12th peak when measuring collagen by SAXS with an X-ray energy of 2.40 keV and a camera length of 825 mm. Additionally, we conducted the model experiment using SX-GISAXS with an X-ray energy of 2.40 keV to confirm that a poly(methyl methacrylate)-poly(n-butyl acrylate) block copolymer thin film has a microphase-separated structure in the thin film, which is composed of lamellae aligned both parallel and perpendicular to the substrate surface. Similarly, in a polystyrene-poly(methyl methacrylate) block copolymer thin film, SX-GISAXS with 3.60 keV and 5.73 keV revealed that hexagonally packed cylinders are aligned parallel to the substrate surface. The incident angle dependence of the first order peak position of the q{sub z} direction obtained from experiments at various incident X-ray energies agrees very well with the theoretical one calculated from the distorted wave Born approximation.

  3. Structural analysis of polymer thin films using GISAXS in the tender X-ray region: Concept and design of GISAXS experiments using the tender X-ray energy at BL-15A2 at the Photon Factory

    Science.gov (United States)

    Takagi, H.; Igarashi, N.; Mori, T.; Saijo, S.; Nagatani, Y.; Ohta, H.; Yamamoto, K.; Shimizu, N.

    2016-10-01

    If small angle X-ray scattering (SAXS) utilizing the soft X-ray region is available, advanced and unique experiments, which differ from traditional SAXS methods, can be realized. For example, grazing-incidence small angle X-ray scattering (GISAXS) using hard X-ray is a powerful tool for understanding the nanostructure in both vertical and lateral directions of thin films, while GISAXS utilizing the tender X-ray region (SX-GISAXS) enables depth-resolved analysis as well as a standard GISAXS analysis in thin films. Thus, at BL-15A2 at the Photon Factory, a dedicated diffractometer for SX-GISAXS (above 2.1 keV) was constructed. This diffractometer is composed of four vacuum chambers and can be converted into the vacuum state from the sample chamber in front of the detector surface. Diffractions are clearly observed until 12th peak when measuring collagen by SAXS with an X-ray energy of 2.40 keV and a camera length of 825 mm. Additionally, we conducted the model experiment using SX-GISAXS with an X-ray energy of 2.40 keV to confirm that a poly(methyl methacrylate)-poly(n-butyl acrylate) block copolymer thin film has a microphase-separated structure in the thin film, which is composed of lamellae aligned both parallel and perpendicular to the substrate surface. Similarly, in a polystyrene-poly(methyl methacrylate) block copolymer thin film, SX-GISAXS with 3.60 keV and 5.73 keV revealed that hexagonally packed cylinders are aligned parallel to the substrate surface. The incident angle dependence of the first order peak position of the qz direction obtained from experiments at various incident X-ray energies agrees very well with the theoretical one calculated from the distorted wave Born approximation.

  4. Recent Developments in the X-Ray Reflectivity Analysis for Rough Surfaces and Interfaces of Multilayered Thin Film Materials

    Directory of Open Access Journals (Sweden)

    Yoshikazu Fujii

    2013-01-01

    Full Text Available X-ray reflectometry is a powerful tool for investigations on rough surface and interface structures of multilayered thin film materials. The X-ray reflectivity has been calculated based on the Parratt formalism, accounting for the effect of roughness by the theory of Nevot-Croce conventionally. However, in previous studies, the calculations of the X-ray reflectivity often show a strange effect where interference effects would increase at a rough surface. And estimated surface and interface roughnesses from the X-ray reflectivity measurements did not correspond to the TEM image observation results. The strange result had its origin in a used equation due to a serious mistake in which the Fresnel transmission coefficient in the reflectivity equation is increased at a rough interface because of a lack of consideration of diffuse scattering. In this review, a new accurate formalism that corrects this mistake is presented. The new accurate formalism derives an accurate analysis of the X-ray reflectivity from a multilayer surface of thin film materials, taking into account the effect of roughness-induced diffuse scattering. The calculated reflectivity by this accurate reflectivity equation should enable the structure of buried interfaces to be analyzed more accurately.

  5. Bone X-Ray (Radiography)

    Science.gov (United States)

    ... clothing that might interfere with the x-ray images. Women should always inform their physician and x-ray ... small burst of radiation that passes through the body, recording an image on photographic film or a special detector. Different ...

  6. Measuring graft stability in a tethered polyelectrolyte film by X-ray and neutron reflectivity

    Science.gov (United States)

    Dimitriou, Michael; Galvin, Casey; Satija, Sushil; Genzer, Jan

    2013-03-01

    The instability of tethered polymer films in mild conditions has recently brought into question the limits of use of such layers in certain technologies, such as anti-fouling coatings. In order to better understand the process of chain degrafting in a polymer brush, we have used X-ray reflectivity (XR) and neutron reflectivity (NR) to examine tethered layers of poly(2-dimethylaminoethyl methacrylate) (PDMAEMA). Exposing an ~ 30 nm thick film of PDMAEMA brushes grafted on flat silica-coated substrates to a range of relative humidities (RH) resulted in reproducible thickness changes as measured by XR, illustrating the need of ambient solvent to induce degrafting. The thickness change showed non-linear behavior, increasing rapidly above ~ 70% RH and swelling to ~ 230% of its original thickness at ~ 99% RH. In order to better understand the apparent diffusive process of vapor into the brush, we have exposed brushes to isotopically labeled vapors. Using XR and NR, we examined the extent of modification in scattering length density within the brush using box and gradient models, and discuss the apparent entropic and enthalpic forces at play. We also conducted in situ aqueous measurements of similar samples to comprehend the degrafting process of a polymer brush. Through an appropriate choice of model, we detect variations in grafting density as a function of incubation time.

  7. Soft X-rays shedding light on thin-film solar cell surfaces and interfaces

    Energy Technology Data Exchange (ETDEWEB)

    Bär, M., E-mail: marcus.baer@helmholtz-berlin.de [Solar Energy Research, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH (HZB), D-14109 Berlin (Germany); Institut für Physik und Chemie, Brandenburgische Technische Universität Cottbus, D-03046 Cottbus (Germany); Department of Chemistry, University of Nevada, Las Vegas (UNLV), Las Vegas, NV 89154 (United States); Pookpanratana, S. [Department of Chemistry, University of Nevada, Las Vegas (UNLV), Las Vegas, NV 89154 (United States); Weinhardt, L. [Department of Chemistry, University of Nevada, Las Vegas (UNLV), Las Vegas, NV 89154 (United States); Institute for Photon Science and Synchrotron Radiation, Karlsruhe Institute of Technology (KIT), D-76344 Eggenstein-Leopoldshafen (Germany); ANKA Synchrotron Radiation Facility, Karlsruhe Institute of Technology, D-76344 Eggenstein-Leopoldshafen (Germany); Wilks, R.G.; Schubert, B.A.; Marsen, B.; Unold, T. [Solar Energy Research, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH (HZB), D-14109 Berlin (Germany); Blum, M.; Krause, S. [Department of Chemistry, University of Nevada, Las Vegas (UNLV), Las Vegas, NV 89154 (United States); Zhang, Y. [Department of Chemistry, University of Nevada, Las Vegas (UNLV), Las Vegas, NV 89154 (United States); Department of Physics, Xiamen University, Xiamen, Fujian 361005 (China); Ranasinghe, A. [Department of Chemistry, University of Nevada, Las Vegas (UNLV), Las Vegas, NV 89154 (United States); Ramanathan, K.; Repins, I.; Contreras, M.A. [National Renewable Energy Laboratory (NREL), Golden, CO 80401 (United States); Nishiwaki, S. [Institute for Energy Conversion (IEC), University of Delaware, Newark, DE 19716 (United States); and others

    2013-10-15

    Highlights: ► S/Se gradient-driven chemical interaction at the CdS/CIG(S)Se interface. ► Depth-dependent band gap in chalcopyrites. ► Band alignment at the CdS/Cu{sub 2}ZnSnS{sub 4} solar cell heterojunction. ► Post-deposition treatment induces intermixing in the CdTe/CdS solar cell structure. -- Abstract: Thin-film solar cells based on compound semiconductors consist of a multilayer structure with various interfaces and contain a multitude of elements and impurities, etc. A rapid progress of these photovoltaic technologies can only be achieved by an insight-driven optimization/development. Hence it is crucial to characterize and understand the relationship between the chemical and electronic properties of these components. This paper reviews some examples of our recent work characterizing compound semiconductor thin films using laboratory- and synchrotron-based electron and soft X-ray spectroscopic characterization methods. It is demonstrated how these different analytical techniques are extraordinarily powerful to reveal the material characteristics from many different perspectives, ultimately resulting in a comprehensive picture of the related electronic and chemical properties. As examples, the paper will discuss the electronic surface structure of chalcopyrite thin-film solar cell absorbers, the chemical structure of the CdS/chalcopyrite interface, present the band alignment at the CdS/kesterite interface, and report on how post-deposition treatments cause chemical interaction/interdiffusion processes in CdTe/CdS thin-film solar cell structures.

  8. Studies on Crystal Orientation of ZnO Film on Sapphire Using High-throughout X-ray Diffraction

    Institute of Scientific and Technical Information of China (English)

    2007-01-01

    The orientation of the nano-columnar ZnO films grown on sapphire using the technique of metal-organic chemical vapor deposition (MOCVD) exhibits deviation because of the mismatch between the crystal lattices of the films and the sapphire substrate. A high-throughout X-ray diffraction method was employed to determine the crystal orientation of the ZnO films at a time scale of the order of minutes based on the general area detection diffraction system (GADDS). This rapid, effective, and ready method, adapted for characterizing the orientation of the nano-columnar crystals is used to directly explain the results of observation of the X-ray diffraction images, by the measurements of the orientations of the crystal columns of the ZnO films along c-axis and in parallel to ab plane.

  9. Polycrystalline lead iodide films produced by solution evaporation and tested in the mammography X-ray energy range

    Science.gov (United States)

    Condeles, J. F.; Mulato, M.

    2016-02-01

    Lead iodide polycrystalline films have been deposited on corning glass substrates using solution evaporation in oven. Films 6 μm-thick were obtained with full coverage of the substrates as verified by scanning electron microscopy. Some pin-holes were observable. X-ray diffraction revealed a crystalline structure corresponding to the 4 H-PbI2 polytype formation. Polarized Raman scattering experiments indicated a lamellar structure. Anisotropy was also investigated using depolarization ratio calculations. The optical and electrical properties of the samples were investigated using photoluminescence and dark conductivity as a function of temperature, respectively. Activation energies of 0.10 up to 0.89 eV were related to two main electrical transport mechanisms. Films were also exposed to X-ray irradiation in the mammography X-ray energy range. The detector produced was also exposed to X-ray from 5 mR up to 1450 mR. A linear response was observed as a function of dose with a slope of 0.52 nA/mm2 per mR.

  10. X-ray absorption spectroscopy of Mn doped ZnO thin films prepared by rf sputtering technique

    Energy Technology Data Exchange (ETDEWEB)

    Yadav, Ashok Kumar; Jha, S. N.; Bhattacharyya, D., E-mail: dibyendu@barc.gov.in [Atomic & Molecular Physics Division, Bhabha Atomic Research Centre, Mumbai – 400 085 (India); Haque, Sk Maidul [Atomic & Molecular Physics Division, Bhabha Atomic Research Centre, VIZAG Centre, Visakhapatnam-530012 (India); Shukla, Dinesh; Choudhary, Ram Janay [UGC DAE Consortium for Scientific Research, Indore-452001 (India)

    2015-11-15

    A set of r.f. sputter deposited ZnO thin films prepared with different Mn doping concentrations have been characterised by Extended X-ray Absorption Fine Structure (EXAFS) and X-ray Absorption Near Edge Spectroscopy (XANES) measurements at Zn, Mn and O K edges and at Mn L{sub 2,3} edges apart from long range structural characterisation by Grazing Incident X-ray Diffraction (GIXRD) technique. Magnetic measurements show room temperature ferromagnetism in samples with lower Mn doping which is however, gets destroyed at higher Mn doping concentration. The results of the magnetic measurements have been explained using the local structure information obtained from EXAFS and XANES measurements.

  11. X-ray - skeleton

    Science.gov (United States)

    ... x-ray particles pass through the body. A computer or special film records the images. Structures that ... M. is also a founding member of Hi-Ethics and subscribes to the principles of the Health ...

  12. Direct X-ray photoconversion in flexible organic thin film devices operated below 1 V.

    Science.gov (United States)

    Basiricò, Laura; Ciavatti, Andrea; Cramer, Tobias; Cosseddu, Piero; Bonfiglio, Annalisa; Fraboni, Beatrice

    2016-10-06

    The application of organic electronic materials for the detection of ionizing radiations is very appealing thanks to their mechanical flexibility, low-cost and simple processing in comparison to their inorganic counterpart. In this work we investigate the direct X-ray photoconversion process in organic thin film photoconductors. The devices are realized by drop casting solution-processed bis-(triisopropylsilylethynyl)pentacene (TIPS-pentacene) onto flexible plastic substrates patterned with metal electrodes; they exhibit a strong sensitivity to X-rays despite the low X-ray photon absorption typical of low-Z organic materials. We propose a model, based on the accumulation of photogenerated charges and photoconductive gain, able to describe the magnitude as well as the dynamics of the X-ray-induced photocurrent. This finding allows us to fabricate and test a flexible 2 × 2 pixelated X-ray detector operating at 0.2 V, with gain and sensitivity up to 4.7 × 10(4) and 77,000 nC mGy(-1) cm(-3), respectively.

  13. Soft x-ray ptychography studies of nanoscale magnetic and structural correlations in thin SmCo{sub 5} films

    Energy Technology Data Exchange (ETDEWEB)

    Shi, X. [Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States); Department of Physics, University of Oregon, Eugene, Oregon 97401 (United States); Fischer, P. [Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States); Department of Physics, University of California, Santa Cruz, California 94056 (United States); Neu, V.; Elefant, D. [IFW Dresden, Institute for Metallic Materials, Helmholtzstr. 20, D-01069 Dresden (Germany); Lee, J. C. T.; Kevan, S. D., E-mail: SDKevan@lbl.gov [Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States); Department of Physics, University of Oregon, Eugene, Oregon 97401 (United States); Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States); Shapiro, D. A.; Farmand, M.; Tyliszczak, T.; Marchesini, S.; Roy, S. [Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States); Shiu, H.-W. [Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States); National Synchrotron Radiation Research Center (NSRRC), 101 Hsin-Ann Road, Hsinchu Science Park, Hsinchu 30076, Taiwan (China)

    2016-02-29

    High spatial resolution magnetic x-ray spectromicroscopy at x-ray photon energies near the cobalt L{sub 3} resonance was applied to probe an amorphous 50 nm thin SmCo{sub 5} film prepared by off-axis pulsed laser deposition onto an x-ray transparent 200 nm thin Si{sub 3}N{sub 4} membrane. Alternating gradient magnetometry shows a strong in-plane anisotropy and an only weak perpendicular magnetic anisotropy, which is confirmed by magnetic transmission soft x-ray microscopy images showing over a field of view of 10 μm a primarily stripe-like domain pattern but with local labyrinth-like domains. Soft x-ray ptychography in amplitude and phase contrast was used to identify and characterize local magnetic and structural features over a field of view of 1 μm with a spatial resolution of about 10 nm. There, the magnetic labyrinth domain patterns are accompanied by nanoscale structural inclusions that are primarily located in close proximity to the magnetic domain walls. Our analysis suggests that these inclusions are nanocrystalline Sm{sub 2}Co{sub 17} phases with nominally in-plane magnetic anisotropy.

  14. Maintaining radiation exposures as low as reasonably achievable (ALARA) for dental personnel operating portable hand-held x-ray equipment.

    Science.gov (United States)

    McGiff, Thomas J; Danforth, Robert A; Herschaft, Edward E

    2012-08-01

    Clinical experience indicates that newly available portable hand-held x-ray units provide advantages compared to traditional fixed properly installed and operated x-ray units in dental radiography. However, concern that hand-held x-ray units produce higher operator doses than fixed x-ray units has caused regulatory agencies to mandate requirements for use of hand-held units that go beyond those recommended by the manufacturer and can discourage the use of this technology. To assess the need for additional requirements, a hand-held x-ray unit and a pair of manikins were used to measure the dose to a simulated operator under two conditions: exposures made according to the manufacturer's recommendations and exposures made according to manufacturer's recommendation except for the removal of the x-ray unit's protective backscatter shield. Dose to the simulated operator was determined using an array of personal dosimeters and a pair of pressurized ion chambers. The results indicate that the dose to an operator of this equipment will be less than 0.6 mSv y⁻¹ if the device is used according to the manufacturer's recommendations. This suggests that doses to properly trained operators of well-designed, hand-held dental x-ray units will be below 1.0 mSv y⁻¹ (2% of the annual occupational dose limit) even if additional no additional operational requirements are established by regulatory agencies. This level of annual dose is similar to those reported as typical dental personnel using fixed x-ray units and appears to satisfy the ALARA principal for this class of occupational exposures.

  15. Note: Setup for chemical atmospheric control during in situ grazing incidence X-ray scattering of printed thin films

    Science.gov (United States)

    Pröller, Stephan; Moseguí González, Daniel; Zhu, Chenhuii; Schaible, Eric; Wang, Cheng; Müller-Buschbaum, Peter; Hexemer, Alexander; Herzig, Eva M.

    2017-06-01

    In order to tailor the assembling of polymers and organic molecules, a deeper understanding of the kinetics involved in thin film production is necessary. While post-production characterization only provides insight on the final film structure, more sophisticated experimental setups are needed to probe the structure formation processes in situ during deposition. The drying kinetics of a deposited organic thin film strongly influences the assembling process on the nanometer scale. This work presents an experimental setup that enables fine control of the atmosphere composition surrounding the sample during slot die coating, while simultaneously probing the film formation kinetics using in situ grazing incidence X-ray scattering and spectroscopy.

  16. Ordered mesoporous silica and alumina thin films studied by X-ray scattering

    Science.gov (United States)

    Klotz, M.; Idrissi-Kandri, N.; Ayral, A.; van der Lee, A.; Guizard, C.

    2002-07-01

    The use of X-ray techniques for the characterisation of ordered mesoporous films is demonstrated. Both silica and alumina thin layers with an ordered mesoporosity are studied using low-angle diffraction and grazing incidence reflectometry. It is shown how the internal structure evolves upon drying and how texture can be easily detected using a two-circle diffractometer. The reflectometry data are correlated with results from nitrogen adsorption/desorption experiments. Nous montrons comment les techniques de rayons-X peuvent être utilisées pour la caractérisation des couches à mésoporosité ordonnée. Des couches minces de silice et d'alumine à mésoporosité ordonnée ont été étudiées par diffraction aux petits angles et réflectométrie en incidence rasante. Il est montré comment la structure interne évolue au cours du séchage et comment la texture peut être analysée en utilisant un diffractomètre deux-cercles. Les données de réflectométrie sont corrélées avec les résultats obtenus par des mesures d'adsorption-désorption d'azote.

  17. X-ray Reciprocal Space Mapping of Graded Al x Ga1 - x N Films and Nanowires.

    Science.gov (United States)

    Stanchu, Hryhorii V; Kuchuk, Andrian V; Kladko, Vasyl P; Ware, Morgan E; Mazur, Yuriy I; Zytkiewicz, Zbigniew R; Belyaev, Alexander E; Salamo, Gregory J

    2016-12-01

    The depth distribution of strain and composition in graded Al x Ga1 - x N films and nanowires (NWs) are studied theoretically using the kinematical theory of X-ray diffraction. By calculating [Formula: see text] reciprocal space maps (RSMs), we demonstrate significant differences in the intensity distributions from graded Al x Ga1 - x N films and NWs. We attribute these differences to relaxation of the substrate-induced strain on the NWs free side walls. Finally, we demonstrate that the developed X-ray reciprocal space map model allows for reliable depth profiles of strain and Al composition determination in both Al x Ga1 - x N films and NWs.

  18. Athermal Energy Loss from X-rays Deposited in Thin Superconducting Films on Solid Substrates

    Science.gov (United States)

    Kozorezov, Alexander G.; Lambert, Colin J.; Bandler, Simon R.; Balvin, Manuel A.; Busch, Sarah E.; Sagler, Peter N.; Porst, Jan-Patrick; Smith, Stephen J.; Stevenson, Thomas R.; Sadleir, John E.

    2013-01-01

    When energy is deposited in a thin-film cryogenic detector, such as from the absorption of an X-ray, an important feature that determines the energy resolution is the amount of athermal energy that can be lost to the heat bath prior to the elementary excitation systems coming into thermal equilibrium. This form of energy loss will be position-dependent and therefore can limit the detector energy resolution. An understanding of the physical processes that occur when elementary excitations are generated in metal films on dielectric substrates is important for the design and optimization of a number of different types of low temperature detector. We have measured the total energy loss in one relatively simple geometry that allows us to study these processes and compare measurements with calculation based upon a model for the various di.erent processes. We have modeled the athermal phonon energy loss in this device by finding an evolving phonon distribution function that solves the system of kinetic equations for the interacting system of electrons and phonons. Using measurements of device parameters such as the Debye energy and the thermal di.usivity we have calculated the expected energy loss from this detector geometry, and also the position-dependent variation of this loss. We have also calculated the predicted impact on measured spectral line-shapes, and shown that they agree well with measurements. In addition, we have tested this model by using it to predict the performance of a number of other types of detector with di.erent geometries, where good agreement is also found.

  19. Micro energy-dispersive X-ray fluoresence mapping of enamel and dental materials after chemical erosion.

    Science.gov (United States)

    Soares, Luís Eduardo Silva; de Oliveira, Rodrigo; Nahórny, Sídnei; Santo, Ana Maria do Espírito; Martin, Airton Abrahão

    2012-10-01

    Energy-dispersive X-ray fluorescence was employed to test the hypothesis that beverage consumption or mouthwash utilization will change the chemical properties of dental materials and enamel mineral content. Bovine enamel samples (n = 45) each received two cavity preparations (n = 90), each pair filled with one of three dental materials (R: nanofilled composite resin; GIC: glass-ionomer cement; RMGIC: resin-modified GIC). Furthermore, they were treated with three different solutions (S: saliva; E: erosion/Pepsi Twist®; or EM: erosion+mouthwash/Colgate Plax®). It was found that mineral loss in enamel was greater in GICE samples than in RE > RMGICE > RMGICEM > REM > GICEM. An increased percentage of Zr was found in REM indicating organic matrix degradation. Dental materials tested (R, GIC, and RMGIC) were not able to protect adjacent enamel from acid erosion by the soft drink tested. The use of mouthwash promoted protection of enamel after erosion by the soft drink. To avoid chemical dissolution by mouthwashes, protection by resin composites with surface sealants is recommended.

  20. Non-destructive elemental quantification of polymer-embedded thin films using laboratory based X-ray techniques

    Energy Technology Data Exchange (ETDEWEB)

    Cordes, Nikolaus L., E-mail: ncordes@lanl.gov [Materials Science and Technology Division, Los Alamos National Laboratory, PO Box 1663, Los Alamos, NM 87545 (United States); Havrilla, George J. [Chemistry Division, Los Alamos National Laboratory, PO Box 1663, Los Alamos, NM 87545 (United States); Usov, Igor O.; Obrey, Kimberly A.; Patterson, Brian M. [Materials Science and Technology Division, Los Alamos National Laboratory, PO Box 1663, Los Alamos, NM 87545 (United States)

    2014-11-01

    Thin coatings are important for a variety of industries including energy (e.g., solar cells, batteries), consumer electronics (e.g., LCD displays, computer chips), and medical devices (e.g., implants). These coatings are typically highly uniform layers with thicknesses ranging from a monolayer up to several micrometers. Characterizing these highly uniform coatings for their thickness, elemental composition, and uniformity are all paramount, but obtaining these measurements can be more difficult when the layers are subsurface and must be interrogated non-destructively. The coupling of confocal micro-X-ray fluorescence (confocal MXRF) and nano-scale X-ray computed tomography (nano-CT) together can make these measurements while meeting these sensitivity and resolution specifications necessary for characterizing thin films. Elemental composition, atomic percent, placement, and uniformity can be measured in three dimensions with this integrated approach. Confocal MXRF uses a pair of polycapillary optics to focus and collect X-rays from a material from a 3D spatially restricted confocal volume. Because of the spatial definition, individual layers (of differing composition) can be characterized based upon the elementally characteristic X-ray fluorescence collected for each element. Nano-scale X-ray computed tomography, in comparison, can image the layers at very high resolution (down to 50 nm) to precisely measure the embedded layer thickness. These two techniques must be used together if both the thickness and atomic density of a layer are unknown. This manuscript will demonstrate that it is possible to measure both the atomic percent of an embedded thin film layer and confirm its manufacturing quality. As a proof of principle, a 1.5 atomic percent, 2 μm-thick Ge layer embedded within polymer capsules, used for laser plasma experiments at the Omega Laser Facility and National Ignition Facility, are measured. - Highlights: • Coupling of confocal X-ray fluorescence

  1. Structural and electrical properties of polycrystalline CdTe films for direct X-ray imaging detectors

    Energy Technology Data Exchange (ETDEWEB)

    Cha, Bo Kyung, E-mail: goldrain99@kaist.ac.kr [Advanced Medical Device Research Center, Korea Electrotechnology Research Institute, Ansan, Repulic of Korea (Korea, Republic of); Yang, Keedong [Advanced Medical Device Research Center, Korea Electrotechnology Research Institute, Ansan, Repulic of Korea (Korea, Republic of); Cha, Eun Seok; Yong, Seok-Min [Department of Materials Science and Engineering, KAIST, Daejeon, Repulic of Korea (Korea, Republic of); Heo, Duchang; Kim, Ryun Kyung; Jeon, Seongchae; Seo, Chang-Woo; Kim, Cho Rong [Advanced Medical Device Research Center, Korea Electrotechnology Research Institute, Ansan, Repulic of Korea (Korea, Republic of); Ahn, Byung Tae [Department of Materials Science and Engineering, KAIST, Daejeon, Repulic of Korea (Korea, Republic of); Lee, Tae-Bum [Advanced Medical Device Research Center, Korea Electrotechnology Research Institute, Ansan, Repulic of Korea (Korea, Republic of)

    2013-12-11

    We introduce polycrystalline cadmium telluride (CdTe) with high atomic number and density, low effective energy and wide band gap for application in large area diagnostic X-ray digital imaging. In this work, polycrystalline CdTe films were fabricated on ITO/glass substrate by both physical vapor deposition (PVD) with slow deposition rate and pressure of 10{sup −6} Torr and the closed space sublimation (CSS) method with high deposition rate and low vacuum pressure(10{sup −2} Torr). The various polycrystalline CdTe films were grown at different deposition rates and substrate temperatures. Physical properties such as microstructures and the crystal structure of the polycrystalline samples were investigated by SEM and XRD patterns respectively. The PVD method resulted in microstructures with columnar shape and more uniform surface, while the CSS method produced microstructures with many larger grains and less uniform surface. The films were polycrystalline structures with a preferential (111) direction. The electrical and optical properties such as the dark current as a function of applied bias voltage and X-ray sensitivity of the fabricated films were measured and investigated under X-ray exposure.

  2. Structural and electrical properties of polycrystalline CdTe films for direct X-ray imaging detectors

    Science.gov (United States)

    Cha, Bo Kyung; Yang, Keedong; Cha, Eun Seok; Yong, Seok-Min; Heo, Duchang; Kim, Ryun Kyung; Jeon, Seongchae; Seo, Chang-Woo; Kim, Cho Rong; Ahn, Byung Tae; Lee, Tae-Bum

    2013-12-01

    We introduce polycrystalline cadmium telluride (CdTe) with high atomic number and density, low effective energy and wide band gap for application in large area diagnostic X-ray digital imaging. In this work, polycrystalline CdTe films were fabricated on ITO/glass substrate by both physical vapor deposition (PVD) with slow deposition rate and pressure of 10-6 Torr and the closed space sublimation (CSS) method with high deposition rate and low vacuum pressure(10-2 Torr). The various polycrystalline CdTe films were grown at different deposition rates and substrate temperatures. Physical properties such as microstructures and the crystal structure of the polycrystalline samples were investigated by SEM and XRD patterns respectively. The PVD method resulted in microstructures with columnar shape and more uniform surface, while the CSS method produced microstructures with many larger grains and less uniform surface. The films were polycrystalline structures with a preferential (111) direction. The electrical and optical properties such as the dark current as a function of applied bias voltage and X-ray sensitivity of the fabricated films were measured and investigated under X-ray exposure.

  3. Focused ion beam patterned Fe thin films A study by selective area Stokes polarimetry and soft x-Ray microscopy

    Energy Technology Data Exchange (ETDEWEB)

    Cook, P. J.; Shen, T. H.; Grundy, P. J.; Im, M.-Y.; Fischer, P.; Morton, S. A.; Kilcoyne, A. L. D.

    2010-11-14

    We demonstrate the potential to modify the magnetic behavior and structural properties of ferromagnetic thin films using focused ion beam 'direct-write' lithography. Patterns inspired by the split-ring resonators often used as components in meta-materials were defined upon 15 nm Fe films using a 30 keV Ga{sup +} focused ion beam at a dose of 2 x 10{sup 16} ions cm{sup -2}. Structural, chemical and magnetic changes to the Fe were studied using transmission soft X-ray microscopy at the ALS, Berkeley CA. X-ray absorption spectra showed a 23% reduction in the thickness of the film in the Ga irradiated areas, but no chemical change to the Fe was evident. X-ray images of the magnetic reversal process show domain wall pinning around the implanted areas, resulting in an overall increase in the coercivity of the film. Transmission electron microscopy showed significant grain growth in the implanted regions.

  4. Experimental study and analytical model of deformation of magnetostrictive films as applied to mirrors for x-ray space telescopes.

    Science.gov (United States)

    Wang, Xiaoli; Knapp, Peter; Vaynman, S; Graham, M E; Cao, Jian; Ulmer, M P

    2014-09-20

    The desire for continuously gaining new knowledge in astronomy has pushed the frontier of engineering methods to deliver lighter, thinner, higher quality mirrors at an affordable cost for use in an x-ray observatory. To address these needs, we have been investigating the application of magnetic smart materials (MSMs) deposited as a thin film on mirror substrates. MSMs have some interesting properties that make the application of MSMs to mirror substrates a promising solution for making the next generation of x-ray telescopes. Due to the ability to hold a shape with an impressed permanent magnetic field, MSMs have the potential to be the method used to make light weight, affordable x-ray telescope mirrors. This paper presents the experimental setup for measuring the deformation of the magnetostrictive bimorph specimens under an applied magnetic field, and the analytical and numerical analysis of the deformation. As a first step in the development of tools to predict deflections, we deposited Terfenol-D on the glass substrates. We then made measurements that were compared with the results from the analytical and numerical analysis. The surface profiles of thin-film specimens were measured under an external magnetic field with white light interferometry (WLI). The analytical model provides good predictions of film deformation behavior under various magnetic field strengths. This work establishes a solid foundation for further research to analyze the full three-dimensional deformation behavior of magnetostrictive thin films.

  5. Characterization of thin-film multilayers using magnetization curves and modeling of low-angle X-ray diffraction data

    Energy Technology Data Exchange (ETDEWEB)

    Lane, M. [Emory & Henry College, VA (United States); Chaiken, A.; Michel, R.P. [Lawrence Livermore National Lab., CA (United States)

    1994-12-01

    We have characterized thin-film multilayers grown by ion-beam sputtering using magnetization curves and modeling of low-angle x-ray diffraction data. In our films, we use ferromagnetic layer = Co, Fe, and NiFe and spacer layer = Si, Ge, FeSi{sub 2}, and CoSi{sub 2}. We have studied the effects of (1) deposition conditions; (2) thickness of layers; (3) different layer materials; and (4) annealing. We find higher magnetization in films grown at 1000V rather than 500V and in films with spacer layers of 50{angstrom} rather than 100{angstrom}. We find higher coercivity in films with cobalt grown on germanium rather than silicon, metal grown on gold underlayers rather than on glass substrates, and when using thinner spacer layers. Finally, modeling reveals that films grown with disilicide layers are more thermally stable than films grown with silicon spacer layers.

  6. Spatial Resolution and Detectability Limits in Thin-Film X-Ray Microanalysis

    Science.gov (United States)

    Goldstein, J. I.; Lyman, C. E.; Zhang, Jing

    1990-01-01

    The major advantages of performing x-ray microanalysis in the analytical electron microscope (AEM) are the high compositional spatial resolution and the elemental analysis sensitivity. Unfortunately, there is usually a trade-off between these two advantages. This paper discusses the factors involved in the optimization of both spatial resolution and sensitivity during x-ray microanalysis and shows the results of such optimization experiments for several AEM instruments.

  7. Oxidation of nanostructured Ti films produced by low energy cluster beam deposition: An X-ray Photoelectron Spectroscopy characterization

    Energy Technology Data Exchange (ETDEWEB)

    Simone, Monica de, E-mail: desimone@tasc.infm.it [CNR-IOM Laboratorio TASC, Area Science Park Basovizza, 34149 Trieste (Italy); Snidero, Elena [CNR-IOM Laboratorio TASC, Area Science Park Basovizza, 34149 Trieste (Italy); Coreno, Marcello [CNR-IMIP, c/o Laboratorio TASC Area Science Park Basovizza, 34149 Trieste (Italy); Sincrotrone Trieste ScpA, Area Science Park Basovizza, 34149 Trieste (Italy); Bongiorno, Gero [Fondazione Filarete, v.le Ortles 22/4, 20139 Milano (Italy); Giorgetti, Luca [Istituto Europeo di Oncologia, Dip. di Oncologia Sperimentale, Via Adamello 16, 20139, Milano (Italy); Amati, Matteo [Sincrotrone Trieste ScpA, Area Science Park Basovizza, 34149 Trieste (Italy); Cepek, Cinzia [CNR-IOM Laboratorio TASC, Area Science Park Basovizza, 34149 Trieste (Italy)

    2012-05-01

    We used in-situ X-ray Photoelectron Spectroscopy (XPS) to study the oxidation process of a cluster-assembled metallic titanium film exposed to molecular oxygen at room temperature. The nanostructured film has been grown on a Si(111) substrate, in ultra high vacuum conditions, by coupling a supersonic cluster beam deposition system with an XPS experimental chamber. Our results show that upon in-situ oxygen exposure Ti{sup 3+} is the first oxidation state observed, followed by Ti{sup 4+}, whereas Ti{sup 2+} is practically absent during the whole process. Our results compare well with the existing literature on Ti films produced using other techniques.

  8. Image quality assurance in X-ray diagnosis - information on DIN 6868, part 2, film processing: Constancy control of visual optical density

    Energy Technology Data Exchange (ETDEWEB)

    Becker-Gaab, C.; Borcke, E.; Bunde, E.; Hagemann, G.; Kuetterer, G.; Lang, G.R.; Schoefer, H.; Stender, H.S.; Stieve, F.E.; Volkmann, T. v.

    1987-02-01

    Good image quality in X-ray diagnosis is the prerequisite for providing the best information possible for making a diagnose quality control of X-ray films is indispensable in order to achieve the objective mentioned above and to reduce both radiation dose and cost.

  9. Gray value differences to dentin of root posts radiographed with digital intraoral systems and conventional X-ray films.

    Science.gov (United States)

    Wicht, S; Pfeiffer, P; Rother, U; Nergiz, I; Schmage, P

    2011-01-01

    This study compared the gray value differences to dentin of titanium and FRC root posts in anterior and posterior teeth radiographed with digital intraoral systems and conventional x-ray film. Radiographic images (n=5) of titanium or fiber-reinforced composite (FRC) root posts placed in extracted teeth were taken with six digital intraoral radiographic devices and conventional x-ray film (control group). Gray value differences were evaluated between the root posts and root dentin. Statistical analyses of the results were performed with three-way and one-way ANOVA with Bonferroni-Dunn's multiple comparisons post-hoc analyses (α=0.05). Significantly higher gray value differences of titanium and FRC posts were found in anterior teeth but not in molars for XIOS, Sidexis and Visualix digital intraoral systems, but not for RVG, DenOptix and VistaScan (FRC posts). Except for DenOptix with incisors and molars and VistaScan with molars, conventional x-ray films showed significantly lower gray value differences of titanium posts in incisors and molars compared to the corresponding digital radiographs.

  10. Crystallographic origin of perpendicular magnetic anisotropy in CoPt film: polarized x-ray absorption study

    Energy Technology Data Exchange (ETDEWEB)

    Pandey, K.K.M.; Chen, J.S.; Liu, T.; Sun, C.J.; Chow, G.M.; (NU Sinapore); (ORNL)

    2009-09-17

    Crystallographic structure, growth induced miscibility gap and strain in Ta/Co{sub 100-x}Pt{sub x} (0 {le} x {le} 43 at%)/Ru/Ta/glass films deposited at ambient temperature were investigated using polarized x-ray absorption spectroscopy to clarify the origin of observed perpendicular magnetic anisotropy (PMA) in Co{sub 72}Pt{sub 28} film. Extended x-ray absorption fine structure spectroscopy data at Co K-edge showed that Co has a similar local atomic environment and averaged interatomic distance in the in-plane and out-of-plane polarization geometries for Co{sub 72}Pt{sub 28}, ruling out the contribution of magneto-elastic anisotropy and growth induced structural anisotropy as the origin of PMA. A large PMA in Co{sub 72}Pt{sub 28} film was attributed to the preferred hexagonal close-packed stacking as observed using the x-ray absorption near-edge structure spectroscopy.

  11. In-situ investigation of Bi thin film condensation by surface sensitive X-ray absorption spectroscopy at cryogenic temperatures

    Energy Technology Data Exchange (ETDEWEB)

    Luetzenkirchen-Hecht, D; Markert, C; Wagner, R; Frahm, R, E-mail: dirklh@uni-wuppertal.d [Dept. of Physics, Univ. of Wuppertal, Gaussstr. 20, 42097 Wuppertal (Germany)

    2009-11-15

    Reflection mode grazing incidence X-ray absorption spectroscopy at the Bi L{sub 3}-edge and simultaneous electrical resistivity measurements were used to investigate the microstructure of quench condensed thin Bi metal films on float-glass substrates at temperatures from 20 K to 300 K. While thin films of {approx} 6 nm thickness appear to be amorphous after deposition at 20 K, thicker films of about 18 nm show the well-known rhombohedral structure of bulk Bi. During a subsequent heat treatment, the amorphous structure of the thin films transforms irreversibly into the crystalline form for temperatures at (42 {+-} 2) K. This crystallisation is accompanied by an irreversible increase of the film resistivity by a factor of more than 2.7. The film density and roughness do not change within detection limits during the heat treatment.

  12. Finite element analyses of thin film active grazing incidence x-ray optics

    Science.gov (United States)

    Davis, William N.; Reid, Paul B.; Schwartz, Daniel A.

    2010-09-01

    The Chandra X-ray Observatory, with its sub-arc second resolution, has revolutionized X-ray astronomy by revealing an extremely complex X-ray sky and demonstrating the power of the X-ray window in exploring fundamental astrophysical problems. Larger area telescopes of still higher angular resolution promise further advances. We are engaged in the development of a mission concept, Generation-X, a 0.1 arc second resolution x-ray telescope with tens of square meters of collecting area, 500 times that of Chandra. To achieve these two requirements of imaging and area, we are developing a grazing incidence telescope comprised of many mirror segments. Each segment is an adjustable mirror that is a section of a paraboloid or hyperboloid, aligned and figure corrected in situ on-orbit. To that end, finite element analyses of thin glass mirrors are performed to determine influence functions for each actuator on the mirrors, in order to develop algorithms for correction of mirror deformations. The effects of several mirror mounting schemes are also studied. The finite element analysis results, combined with measurements made on prototype mirrors, will be used to further refine the correction algorithms.

  13. Structure and Growth of Vapor-Deposited n-Dotriacontane Films Studied by X-ray Reflectivity

    DEFF Research Database (Denmark)

    del Campo, V.; Cisternas, E.; Taub, H.;

    2009-01-01

    We have used synchrotron X-ray reflectivity measurements to investigate the structure of n-dotriacontane (n-C32H66 or C32) films deposited from the vapor phase onto a SiO2-coated Si(100) surface. Our primary motivation was to determine whether the structure and growth mode of these films differ...... complete bilayer adjacent to the SiO2 surface formed by C32 molecules aligned with their long axis parallel to the interface followed by one or more partial layers of perpendicular molecules. These molecular layers coexist with bulk particles at higher coverages. Furthermore, after thermally cycling our...

  14. Hydrogen concentration and mass density of diamondlike carbon films obtained by x-ray and neutron reflectivity

    DEFF Research Database (Denmark)

    Findeisen, E.; Feidenhans'l, R.; Vigild, Martin Etchells

    1994-01-01

    Specular reflectivity of neutrons and x rays can be used to determine the scattering length density profile of a material perpendicular to its surface. We have applied these techniques to study amorphous, diamondlike, hydrocarbon films. By the combination of these two techniques we obtain not only...... the mass density, but also the concentration of hydrogen, which varies in our case between 0 and 30 at.%. This method is a new and nondestructive way to determine the concentration of hydrogen within an error of less than 2 at.% in samples with sharp interfaces. It is especially suited for diamondlike...... carbon films....

  15. X-ray Photoelectron Spectroscopy on Superconducting Tl2CaBa2Cu2O8 Thin Film

    Science.gov (United States)

    Zeng, Wensheng; Qiu, Ping; Yan, Shaolin; Li, Zengfa; Zhang, Guangyin

    1991-06-01

    We have prepared single-phase superconducting Tl2CaBa2Cu2O8 thin film by dc magnetron sputtering process and measured x-ray photoelectron spectra of the film at room and liquid nitrogen temperatures. From the relative intensities of the Ba3d, Tl4f. O1s and Cu2p spectra taken at different take-off angles, we have concluded that there is an adventitious contamination (nonsuperconducting phase) surface layer. After excluding contributions from these spurious phases, we have tentatively assigned which core-level shifts should be caused by the superconducting phase transition.

  16. Perpendicular magnetic anisotropy in ultrathin Co|Ni multilayer films studied with ferromagnetic resonance and magnetic x-ray microspectroscopy

    Energy Technology Data Exchange (ETDEWEB)

    Macia, F., E-mail: ferran.macia@gmail.com [Department of Physics, New York University, 4 Washington Place, New York, NY 10003 (United States); Warnicke, P. [National Synchrotron Light Source, Brookhaven National Laboratory, Upton, NY 11973 (United States); Bedau, D. [Department of Physics, New York University, 4 Washington Place, New York, NY 10003 (United States); Im, M.-Y.; Fischer, P. [Center for X-ray Optics, Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States); Arena, D.A. [National Synchrotron Light Source, Brookhaven National Laboratory, Upton, NY 11973 (United States); Kent, A.D. [Department of Physics, New York University, 4 Washington Place, New York, NY 10003 (United States)

    2012-11-15

    Ferromagnetic resonance (FMR) spectroscopy, x-ray magnetic circular dichroism (XMCD) spectroscopy and magnetic transmission soft x-ray microscopy (MTXM) experiments have been performed to gain insight into the magnetic anisotropy and domain structure of ultrathin Co|Ni multilayer films with a thin permalloy layer underneath. MTXM images with a spatial resolution better than 25 nm were obtained at the Co L{sub 3} edge down to an equivalent thickness of Co of only 1 nm, which establishes a new lower boundary on the sensitivity limit of MTXM. Domain sizes are shown to be strong functions of the anisotropy and thickness of the film. - Highlights: Black-Right-Pointing-Pointer We show record sensitivity of x-ray microscopy in a 1 nm Co effective thickness. Black-Right-Pointing-Pointer We found extreme sensitivity of the domain structure to number of bilayer repeats. Black-Right-Pointing-Pointer Perpendicular anisotropy is nearly independent of the number of bilayers. Black-Right-Pointing-Pointer We have combined Ferromagnetic resonance and high resolution XMCD microscopy.

  17. MONITORING OF INDIVIDUAL DOSES FOR MEDICAL WORKERS OF DENTAL POLYCLINIC’S X-RAY ROOMS IN DUSHANBE, THE REPUBLIC OF TADJIKISTAN

    Directory of Open Access Journals (Sweden)

    N. U. Hakimova

    2016-01-01

    Full Text Available The article presents the data and analyses of personnel’s average annual external exposure doses monitoring via the thermoluminescent dosimetry method used for X-ray radiological personnel in dental polyclinics of Dushanbe, Tadjikistan Republic over a 5-year period ( 2010–2014 . Out of 42 registered medical institutions dental polyclinics amounted up to only just 14%. For this work thermoluminescent dosimeters were used ( with LiF: Mg, Ti with the thermoluminescent dosimetric installation “ Harshaw – 4500” as the reader device. Monitoring results comparison of individual dose equivalent Hp ( 10 values was conducted for two groups of medical workers: medical doctors and X-ray lab technicians. It is demonstrated that radiological technicians’ professional exposure doses are on the average by 23% higher than those for medical doctors.The average individual exposure doses over the above indicated period amount to 0,93 mSv and 1,3 mSv for doctors and X-ray lab technicians, respectively, and are in the range from 0,45 mSv to 2,39 mSv. The doses include contribution from the natural background. The values of doses recorded for the personnel in dental polyclinic correspond to those recorded for the workers in the routine X-ray rooms.

  18. Crystal Tilts in Epitaxially Laterally Overgrown GaN Films Determined by Four-Circle X-Ray Diffraction

    Institute of Scientific and Technical Information of China (English)

    汪峰; 张荣; 陈志忠; 吴小山; 顾书林; 沈波; 郑有堃; 蒋树声

    2001-01-01

    Crystal tilts in epitaxially laterally overgrown (ELO) GaN films via hydride vapour phase epitaxy (HVPE) onsapphire substrates have been investigated by using the four-circle x-ray diffraction method. Three diffractionpeaks corresponding to the (0002) reflection of vertically epitaxial and tilted GaN domains are observable in thex-ray rocking curve. The angle separations △ω between the main peak and two lobes change with the azimuthangle φ. The dependence of △ω on φ and the crystal tilt angle θ has been calculated based on the standardkinetic x-ray diffraction model. The crystal tilt angle of a typical HVPE ELO GaN sample has been determinedto be 2.379°.

  19. Using iridium films to compensate for piezo-electric materials processing stresses in adjustable x-ray optics

    Science.gov (United States)

    Ames, A.; Bruni, R.; Cotroneo, V.; Johnson-Wilke, R.; Kester, T.; Reid, P.; Romaine, S.; Tolier-McKinstry, S.; Wilke, R. H. T.

    2015-09-01

    Adjustable X-ray optics represent a potential enabling technology for simultaneously achieving large effective area and high angular resolution for future X-ray Astronomy missions. The adjustable optics employ a bimorph mirror composed of a thin (1.5 μm) film of piezoelectric material deposited on the back of a 0.4 mm thick conical mirror segment. The application of localized electric fields in the piezoelectric material, normal to the mirror surface, result in localized deformations in mirror shape. Thus, mirror fabrication and mounting induced figure errors can be corrected, without the need for a massive reaction structure. With this approach, though, film stresses in the piezoelectric layer, resulting from deposition, crystallization, and differences in coefficient of thermal expansion, can distort the mirror. The large relative thickness of the piezoelectric material compared to the glass means that even 100MPa stresses can result in significant distortions. We have examined compensating for the piezoelectric processing related distortions by the deposition of controlled stress chromium/iridium films on the front surface of the mirror. We describe our experiments with tuning the product of the chromium/iridium film stress and film thickness to balance that resulting from the piezoelectric layer. We also evaluated the repeatability of this deposition process, and the robustness of the iridium coating.

  20. Characterization of Scattered X-Ray Photons in Dental Cone-Beam Computed Tomography.

    Directory of Open Access Journals (Sweden)

    Ching-Ching Yang

    Full Text Available Scatter is a very important artifact causing factor in dental cone-beam CT (CBCT, which has a major influence on the detectability of details within images. This work aimed to improve the image quality of dental CBCT through scatter correction.Scatter was estimated in the projection domain from the low frequency component of the difference between the raw CBCT projection and the projection obtained by extrapolating the model fitted to the raw projections acquired with 2 different sizes of axial field-of-view (FOV. The function for curve fitting was optimized by using Monte Carlo simulation. To validate the proposed method, an anthropomorphic phantom and a water-filled cylindrical phantom with rod inserts simulating different tissue materials were scanned using 120 kVp, 5 mA and 9-second scanning time covering an axial FOV of 4 cm and 13 cm. The detectability of the CT image was evaluated by calculating the contrast-to-noise ratio (CNR.Beam hardening and cupping artifacts were observed in CBCT images without scatter correction, especially in those acquired with 13 cm FOV. These artifacts were reduced in CBCT images corrected by the proposed method, demonstrating its efficacy on scatter correction. After scatter correction, the image quality of CBCT was improved in terms of target detectability which was quantified as the CNR for rod inserts in the cylindrical phantom.Hopefully the calculations performed in this work can provide a route to reach a high level of diagnostic image quality for CBCT imaging used in oral and maxillofacial structures whilst ensuring patient dose as low as reasonably achievable, which may ultimately make CBCT scan a reliable and safe tool in clinical practice.

  1. Guideline development and impact assessment for registration of medical, dental and veterinary x-ray apparatus

    Energy Technology Data Exchange (ETDEWEB)

    Colgan, P.; Harrison, D. [NSW Environment Protection Authority, Lidcombe, NSW, (Australia). Radiation Control Centre; Moore, W. [NSW Environmental Protection Authority, Chatswood, NSW, (Australia). Economics and Environmental Reporting Branch

    1996-10-01

    Under the NSW Radiation Control Act 1990, radiation apparatus used for diagnostic medical, dental and veterinary purposes will be required to become registered. The inspection required prior to registration will be conducted by a Consulting Radiation Expert who has been accredited by the Environment Protection Authority (EPA) as being competent in the field of quality assurance assessment of radiation apparatus used for diagnostic medical, dental and veterinary purposes. When regulating any activity in NSW, there is a requirement to undertake a regulatory impact statement of the proposed regulation. In addition, the introduction of any accompanying guideline requires a cost-benefit analysis. Costs may include enforcement, administrative and compliance activities. The calculation of benefit relies heavily on the improvement in apparatus performance (and hence dose reduction) that can be obtained with the introduction of a mandatory practice such as apparatus registration. This paper discusses the development of the registration guideline for NSW, including a summary of the public comments received. It further discusses the methodology and data used for the accompanying cost-benefit analysis. Information in this paper is presented in three parts: EPA field survey, cost analysis, and benefit analysis. For NSW it was estimated that the introduction of registration of these apparatus, over a two year period, would result in early replacement and repair costs (present values) to the medical industry of between $5.7 and $11.0 million, with an additional $2.5 million in EPA enforcement costs. The introduction of the proposed system of registration is expected to result in an estimated savings in quantifiable health detriment costs to NSW of between $11.8 and $17.7 million, and reduce the risk of radiation induced mortality. (authors). 4 refs., 11 tabs.

  2. Comparison of the responses of TLD-100 and radiochromic films exposed to X-rays of low energy in a radiodiagnostic clinical treatment

    Energy Technology Data Exchange (ETDEWEB)

    Castro, M.; Mesa, F.; Sosa, M. [Physics Institute, University of Guanajuato, Loma del Bosque 103, Lomas del Campestre, 37150 Leon, Guanajuato (Mexico)

    2007-07-01

    Full text: In this work a comparison of the responses of a TLD-100 and a radiochromic film exposed to a low energy X-ray beam is presented. X-rays in the range of 20 to 120 KV from a clinical machine at the radiodiagnostic unit of the IMSS-Tl hospital in Leon were used. The processes of calibration of both the TLD-100 and the radiochromic films are also discussed. (Author)

  3. Grazing-incidence small-angle X-ray scattering: New tool for studying thin film growth

    Energy Technology Data Exchange (ETDEWEB)

    Levine, J.R.; Cohen, J.B.; Chung, Y.W.; Georgopoulos, P. (Northwestern Univ., Evanston, IL (USA). Dept. of Materials Science and Engineering)

    1989-12-01

    Grazing-incidence small-angle X-ray scattering (GISAXS) is introduced as a method of studying discontinuous thin films. In this method, the incident beam is totally externally reflected from the substrate followed by small-angle scattering of the refacted beam by the thin film. The experiment described establishes the ability of GISAXS to provide size information for islands formed in the initial stages of thin film growth. The data presented are for gold films of 7 and 15 A average thicknesses on Corning 7059 glass substrates. The advantages of this technique are that it is non-destructive, can be done in situ, provides excellent sampling statistics, does not necessarily require a synchrotron source, and is not limited to thin or conducting substrates. (orig.).

  4. Multiple scattering in grazing-incidence X-ray diffraction: impact on lattice-constant determination in thin films

    Energy Technology Data Exchange (ETDEWEB)

    Resel, Roland, E-mail: roland.resel@tugraz.at; Bainschab, Markus; Pichler, Alexander [Graz University of Technology, Graz (Austria); Dingemans, Theo [Delft University of Technology, Delft (Netherlands); Simbrunner, Clemens [Johannes Kepler University, Linz (Austria); University of Bremen, Bremen (Germany); Stangl, Julian [Johannes Kepler University, Linz (Austria); Salzmann, Ingo [Humboldt University, Berlin (Germany)

    2016-04-20

    The use of grazing-incidence X-ray diffraction to determine the crystal structure from thin films requires accurate positions of Bragg peaks. Refraction effects and multiple scattering events have to be corrected or minimized. Dynamical scattering effects are observed in grazing-incidence X-ray diffraction experiments using an organic thin film of 2,2′:6′,2′′-ternaphthalene grown on oxidized silicon as substrate. Here, a splitting of all Bragg peaks in the out-of-plane direction (z-direction) has been observed, the magnitude of which depends both on the incidence angle of the primary beam and the out-of-plane angle of the scattered beam. The incident angle was varied between 0.09° and 0.25° for synchrotron radiation of 10.5 keV. This study reveals comparable intensities of the split peaks with a maximum for incidence angles close to the critical angle of total external reflection of the substrate. This observation is rationalized by two different scattering pathways resulting in diffraction peaks at different positions at the detector. In order to minimize the splitting, the data suggest either using incident angles well below the critical angle of total reflection or angles well above, which sufficiently attenuates the contributions from the second scattering path. This study highlights that the refraction of X-rays in (organic) thin films has to be corrected accordingly to allow for the determination of peak positions with sufficient accuracy. Based thereon, a reliable determination of the lattice constants becomes feasible, which is required for crystallographic structure solutions from thin films.

  5. Dosimetric study of the effective doses resulting during dental X-ray and panoramic radiography

    Science.gov (United States)

    Shousha, Hany A.; Abd-El Hafez, A. I.; Ahmad, Fawzia

    2011-01-01

    The panoramic image is one of the most commonly used radiographic examinations in dentistry, owing to its low dose and large area for evaluation, including bone and teeth in the same image. Although digital images are usually reported to deliver a lower radiation dose to the patient, conventional images are still available, especially in countries where digital systems are not widely economically available. Dentists should weigh the benefits of dental radiographs against the consequences of increasing a patient's exposure to radiation, the effects of which accumulate from multiple sources over time. The "as low as reasonably achievable" principle should be followed to minimize the exposure to radiation. The purpose of this investigation is to measure the absorbed radiation doses at 12 anatomical sites of a Rando-phantom and calculate the effective doses result from a full-mouth survey and panoramic radiography. Organ-absorbed doses are measured using thermoluminescent dosimeters (TLD 100) and effective organ doses (μ Sv) are estimated according to the International Commission on Radiological Protection in 2007. The total effective dose results from the panoramic imaging system have so far been below those obtained using the full-mouth survey technique used in intra-oral radiographic examination.

  6. Study on the effect of x-ray radiation on the dental extraction wounds

    Energy Technology Data Exchange (ETDEWEB)

    Shimizu, Takefumi (Nihon Univ., Tokyo. School of Dentistry)

    1982-03-01

    Male Donryu rats were irradiated with 1,500 rad (group 2) or 2,000 rad (group 3) with a 10 MeV electron beam. Seven days later their first left upper molar (M1) was extracted, and the dental extraction wound was examined histopathologically 3, 7, 14, 21, 35, 49 and 90 days later (5 rats each day). The findings were compared with those obtained on nonirradiated rats whose M1 were also removed (group 1). Covering by epithelium was seen on all the rats in group 1 on the 7th day after tooth extraction, in group 2 on the 21st day, and in group 3 on the 49th day. The bone absorption of tooth extraction lacuna in group 2 and 3 was prominent, increasing with time, as compared with group 1. Sequester formation was particularly prominent in group 3, and in many cases the extraction lacuna was malformed. Restoration by regenerated bone was detected in group 1 on the 14th day after tooth extraction, and in group 2 on the 35th day, but it was only slight in group 3 even on the 90th day. Therefore, it was clear that irradiation of the upper jaw of rats before tooth extraction caused delayed healing of the lacuna of the extracted tooth, and that the effect was dose dependent.

  7. In situ X-ray diffraction study of crystallization process of GeSbTe thin films during heat treatment

    Energy Technology Data Exchange (ETDEWEB)

    Kato, Naohiko [Toyota Central R and D Labs., Inc., Nagakute, Aichi 480-1192 (Japan)]. E-mail: e0957@mosk.tytlabs.co.jp; Konomi, Ichiro [Toyota Central R and D Labs., Inc., Nagakute, Aichi 480-1192 (Japan); Seno, Yoshiki [Toyota Central R and D Labs., Inc., Nagakute, Aichi 480-1192 (Japan); Motohiro, Tomoyoshi [Toyota Central R and D Labs., Inc., Nagakute, Aichi 480-1192 (Japan)

    2005-05-15

    The crystallization processes of the Ge{sub 2}Sb{sub 2}Te{sub 5} thin film used for PD and DVD-RAM were studied in its realistic optical disk film configurations for the first time by X-ray diffraction using an intense X-ray beam of a synchrotron orbital radiation facility (SPring-8) and in situ quick detection with a Position-Sensitive-Proportional-Counter. The dependence of the amorphous-to-fcc phase-change temperature T{sub 1} on the rate of temperature elevation R{sub et} gave an activation energy E{sub a}: 0.93 eV much less than previously reported 2.2 eV obtained from a model sample 25-45 times thicker than in the real optical disks. The similar measurement on the Ge{sub 4}Sb{sub 1}Te{sub 5} film whose large reflectance change attains the readability by CD-ROM drives gave E{sub a}: 1.13 eV with larger T{sub 1} than Ge{sub 2}Sb{sub 2}Te{sub 5} thin films at any R{sub et} implying a lower sensitivity in erasing as well as a better data stability of the phase-change disk.

  8. X-ray magnetic spectroscopy of MBE-grown Mn-doped Bi2Se3 thin films

    Directory of Open Access Journals (Sweden)

    L. J. Collins-McIntyre

    2014-12-01

    Full Text Available We report the growth of Mn-doped Bi2Se3 thin films by molecular beam epitaxy (MBE, investigated by x-ray diffraction (XRD, atomic force microscopy (AFM, SQUID magnetometry and x-ray magnetic circular dichroism (XMCD. Epitaxial films were deposited on c-plane sapphire substrates by co-evaporation. The films exhibit a spiral growth mechanism typical of this material class, as revealed by AFM. The XRD measurements demonstrate a good crystalline structure which is retained upon doping up to ∼7.5 atomic-% Mn, determined by Rutherford backscattering spectrometry (RBS, and show no evidence of the formation of parasitic phases. However an increasing interstitial incorporation of Mn is observed with increasing doping concentration. A magnetic moment of 5.1 μB/Mn is obtained from bulk-sensitive SQUID measurements, and a much lower moment of 1.6 μB/Mn from surface-sensitive XMCD. At ∼2.5 K, XMCD at the Mn L2,3 edge, reveals short-range magnetic order in the films and indicates ferromagnetic order below 1.5 K.

  9. X-ray Photoelectron Spectroscopy Study of Indium Tin Oxide Films Deposited at Various Oxygen Partial Pressures

    Science.gov (United States)

    Peng, Shou; Cao, Xin; Pan, Jingong; Wang, Xinwei; Tan, Xuehai; Delahoy, Alan E.; Chin, Ken K.

    2017-02-01

    Here, a systematic experimental study on indium tin oxide (ITO) films is presented to investigate the effects of oxygen partial pressure on the film's electrical properties. The results of Hall measurements show that adding more oxygen in the sputtering gas has negative influences on the electrical conductivity of ITO films. As O2/(O2 + Ar)% in the sputtering gas is increased from 0 to 6.98%, the resistivity of ITO film rises almost exponentially from 7.9 × 10-4 to 4.1 × 10-2 Ω cm, with the carrier density decreasing from 4.8 × 1020 to 5.4 × 1018 cm-3. The origins of these negative effects are discussed with focuses on the concentration of ionized impurities and the scattering of grain barriers. Extensive x-ray photoelectron spectroscopy (XPS) analyses were employed to gain insight into the concentration of ionized impurities, demonstrating a strong correlation between the oxygen vacancy concentration and the carrier density in ITO films as a function of sputtering O2 partial pressure. Other microstructural characterization techniques including x-ray diffraction (XRD), high-magnification scanning electron microscopy (SEM) and scanning transmission electron microscopy (STEM) analyses were used to evaluate the average grain size of ITO films. For ITO films that have carrier density above 1019 cm-3, scattering on grain boundaries and other crystallographic defects show negligible effects on the carrier transport. The results point to the oxygen vacancy concentration that dictates the carrier density and, thus, the resistivity of magnetron-sputtered ITO films.

  10. Analysis of Dental Enamel Surface Submitted to Fruit Juice Plus Soymilk by Micro X-Ray Fluorescence: In Vitro Study

    Directory of Open Access Journals (Sweden)

    Janaína Salmos Brito

    2016-01-01

    Full Text Available Objective. This paper aimed to analyze the in vitro industrialized fruit juices effect plus soy to establish the erosive potential of these solutions. Materials and Methods. Seventy bovine incisors were selected after being evaluated under stereomicroscope. Their crowns were prepared and randomly divided into 7 groups, using microhardness with allocation criteria. The crowns were submitted to the fruit juice plus soy during 15 days, twice a day. The pH values, acid titration, and Knoop microhardness were recorded and the specimens were evaluated using X-ray microfluorescence (µXRF. Results. The pH average for all juices and after 3 days was significantly below the critical value for dental erosion. In average, the pH value decreases 14% comparing initial time and pH after 3 days. Comparing before and after, there was a 49% microhardness decrease measured in groups (p<0.05. Groups G1, G2, G5, and G6 are above this average. The analysis by μXRF showed a decrease of approximately 7% Ca and 4% P on bovine crowns surface. Florida (FL statistical analysis showed a statistically significant 1 difference between groups. Thus, a tooth chance to suffer demineralization due to industrialized fruit juices plus soy is real.

  11. Comparative study with CT and plain X-ray film on the diagnosis of interstitial pulmonary diseases of patients with rheumatoid arthritis

    Energy Technology Data Exchange (ETDEWEB)

    Fujii, Masahiko; Adachi, Shuji; Tanaka, Koji; Shimizu, Tadafumi; Hirota, Shozo; Sako, Masao; Kono, Michio; Imura, Shigeaki.

    1989-01-01

    In order to detect the interstitial pulmonary disease of rheumatoid arthritis (RA), we studied 91 patients with RA and compared the appearances of high resolution CT with those of plain chest X-ray film. We found 43 cases of interstitial pneumonitis on CT. We classified the CT and X-ray appearances as 4 groups (0-3) based on the degrees of pulmonary lesions. The both classifications accorded only in 46 cases (51%). In 46 cases who were not detected any changes by plain X-ray film, 17 were detected interstitial changes by CT. As to the early interstitial changes, the detectability of CT was superior to that of plain X-ray film.

  12. Dental biothermophotonics: How photothermal methods are winning the race with X-rays for dental caries diagnostic needs of clinical dentistry

    Science.gov (United States)

    Mandelis, A.; Jeon, R.; Matvienko, A.; Abrams, S. H.; Amaechi, B. T.

    2008-01-01

    Recent trends in biothermophotonics of teeth are presented. The presentation is centered on the development of clinical-level frequency-domain photothermal radiometry and modulated luminescence to address issues associated with the early diagnosis of demineralization caries in human teeth. Biothermophotonic principles and applications to the detection of the carious state in human teeth as embodied by laser photothermal radiometry are presented and further supported by modulated luminescence. The emphasis is on recent developments with regard to abilities of these techniques to diagnose interproximal lesions between teeth, etching with phosphoric acid and with an artificial demineralization gel in order to simulate early demineralization, as well as demineralization and remineralization of dental crown enamel and root dentin. These are lesions which normally go undetected by X-ray radiographs. Comparisons with X rays, Micro-Computed Tomography (μ-CT) and Transverse Micro-Radiography (TMR) are discussed. A theoretical model involving coupled diffuse photon density and thermal-wave fields is developed and applied to frequency scans from demineralized artificial lesions to produce quantitative values for optical and thermophysical parameters of teeth as well as the thickness of the induced lesion.

  13. Radiation damage in polymer films from grazing-incidence X-ray scattering measurements

    Energy Technology Data Exchange (ETDEWEB)

    Vaselabadi, Saeed Ahmadi [Department of Chemical and Biomolecular Engineering, University of Houston, Houston Texas 77204-4004; Shakarisaz, David [Department of Electrical and Computer Engineering, University of Houston, Houston Texas 77204-4005; Ruchhoeft, Paul [Department of Electrical and Computer Engineering, University of Houston, Houston Texas 77204-4005; Strzalka, Joseph [X-Ray Science Division, Argonne National Laboratory, Argonne Illinois 60439; Stein, Gila E. [Department of Chemical and Biomolecular Engineering, University of Houston, Houston Texas 77204-4004

    2016-02-16

    Grazing-incidence X-ray scattering (GIXS) is widely used to analyze the crystallinity and nanoscale structure in thin polymer lms. However, ionizing radiation will generate free radicals that initiate cross-linking and/or chain scission, and structural damage will impact the ordering kinetics, thermodynamics, and crystallinity in many polymers. We report a simple methodology to screen for beam damage that is based on lithographic principles: lms are exposed to patterns of x-ray radiation, and changes in polymer structure are revealed by immersing the lm in a solvent that dissolves the shortest chains. The experiments are implemented with high throughput using the standard beam line instrumentation and a typical GIXS configuration. The extent of damage (at a fixed radiation dose) depends on a range of intrinsic material properties and experimental variables, including the polymer chemistry and molecular weight, exposure environment, llm thickness, and angle of incidence. The solubility switch for common polymers is detected within 10-60 sec at ambient temperature, and we verified that this first indication of damage corresponds with the onset of network formation in glassy polystyrene and a loss of crystallinity in polyalkylthiophenes. Therefore, grazing-incidence x-ray patterning offers an efficient approach to determine the appropriate data acquisition times for any GIXS experiment.

  14. OPTIMIZATION OF X-RAY DIAGNOSIS OF ANKYLOSING SPONDYLITIS IN CLINICAL PRACTICE: IMPORTANCE OF A PLAIN X-RAY FILM OF THE PELVIS

    Directory of Open Access Journals (Sweden)

    A. V. Smirnov

    2015-01-01

    Full Text Available Ankylosing spondylitis (AS is a disease whose main clinical manifestation  is an inflammatory lesion in the axial skeleton with its gradual ankylosing. The peak incidence of AS occurs at a young age; and, if there is no timely adequate therapy, its disability rates are virtually as high as 50% ten years after disease onset, which determines the social importance of this disease The diagnosis of AS is based on its characteristic  clinical presentation  and the compulsory detection  of sacroiliitis on pelvic radiography. However, the existing reports of the X-ray stages of sacroiliac joint injuries in the literature provide little evidence and frequently misinterpret  radiographic changes. Based on their long-term  experience, the authors give expanded explanations of the standard X-ray stages of sacroiliitis and other radiographic signs that can make a diagnostic search in AS easier.

  15. X-ray absorption spectroscopy and magnetic circular dichroism studies of L1{sub 0}-Mn-Ga thin films

    Energy Technology Data Exchange (ETDEWEB)

    Glas, M., E-mail: mglas@physik.uni-bielefeld.de; Sterwerf, C.; Schmalhorst, J. M.; Reiss, G. [Thin Films and Physics of Nanostructures, Bielefeld University, Bielefeld (Germany); Ebke, D. [Thin Films and Physics of Nanostructures, Bielefeld University, Bielefeld (Germany); Max Planck Institute for Chemical Physics of Solids, Dresden (Germany); Jenkins, C.; Arenholz, E. [ALS Berkeley, California 94720-8229 (United States)

    2013-11-14

    Tetragonally distorted Mn{sub 3−x}Ga{sub x} thin films with 0.1films with MgO is problematic due to oxide formation, we examined the influence of a CoFeB interlayer and of two different deposition methods for the MgO barrier on the formation of interfacial Mn-O for Mn{sub 62}Ga{sub 38} by element specific X-ray absorption spectroscopy (XAS) and magnetic circular dichroism (XMCD). A highly textured L1{sub 0} crystal structure of the Mn-Ga films was verified by X-ray diffraction measurements. For samples with e-beam evaporated MgO barrier no evidence for Mn-O was found whereas in samples with magnetron sputtered MgO, Mn-O was detected, even for the thickest interlayer thickness. Both XAS and XMCD measurements showed an increasing interfacial Mn-O amount with decreasing CoFeB interlayer thickness. Additional element specific full hysteresis loops determined an out-of-plane magnetization axis for the Mn and Co, respectively.

  16. Exceptionally strong Bragg diffraction from a mesoporous silica film pretreated with chlorotrimethylsilane toward application in X-ray optics.

    Science.gov (United States)

    Kubo, Wataru; Takahashi, Masahiko; Komoto, Atsushi; Okamoto, Kohei; Miyata, Hirokatsu

    2012-01-28

    Exceptionally strong Bragg diffraction from a mesoporous silica film is achieved by exposing the as-deposited film to vapor of chlorotrimethylsilane (Me(3)SiCl) before extracting the surfactant. The intensity of the X-ray diffraction peak increased 7 times after the surfactant removal and it approached 30% reflectivity. This large increase of diffraction intensity cannot be explained simply by the improved contrast of the electron density, and rearrangement of the pore wall during the Me(3)SiCl vapor treatment is suggested. It is shown by infrared spectroscopy that Me(3)SiCl with a high grafting reactivity effectively caps the silanol groups and prevents the following condensation, which causes the structural degradation. The substitution of the hydrogen atom of hydroxyl groups with trimethylsilyl groups should help the improvement of the structural regularity by reducing the hydrogen bonds in the pore wall. The achieved strong diffraction opens the gate for the application of these regular mesoporous films prepared by a self-assembly process to optical elements in the X-ray region.

  17. X-ray absorption spectroscopy and magnetic circular dichroism studies of L10-Mn-Ga thin films

    Science.gov (United States)

    Glas, M.; Sterwerf, C.; Schmalhorst, J. M.; Ebke, D.; Jenkins, C.; Arenholz, E.; Reiss, G.

    2013-11-01

    Tetragonally distorted Mn3-xGax thin films with 0.1magnetic anisotropy and low magnetization and thus have the potential to serve as electrodes in spin transfer torque magnetic random access memory. Because a direct capping of these films with MgO is problematic due to oxide formation, we examined the influence of a CoFeB interlayer and of two different deposition methods for the MgO barrier on the formation of interfacial Mn-O for Mn62Ga38 by element specific X-ray absorption spectroscopy (XAS) and magnetic circular dichroism (XMCD). A highly textured L10 crystal structure of the Mn-Ga films was verified by X-ray diffraction measurements. For samples with e-beam evaporated MgO barrier no evidence for Mn-O was found whereas in samples with magnetron sputtered MgO, Mn-O was detected, even for the thickest interlayer thickness. Both XAS and XMCD measurements showed an increasing interfacial Mn-O amount with decreasing CoFeB interlayer thickness. Additional element specific full hysteresis loops determined an out-of-plane magnetization axis for the Mn and Co, respectively.

  18. Analysis of Electrodeposited Nickel-Iron Alloy Film Composition Using Particle-Induced X-Ray Emission

    Directory of Open Access Journals (Sweden)

    Alyssa A. Frey

    2011-01-01

    Full Text Available The elemental composition of electrodeposited NiFe thin films was analyzed with particle-induced X-ray emission (PIXE. The thin films were electrodeposited on polycrystalline Au substrates from a 100 mM NiSO4, 10 mM FeSO4, 0.5 M H3BO3, and 1 M Na2SO4 solution. PIXE spectra of these films were analyzed to obtain relative amounts of Ni and Fe as a function of deposition potential and deposition time. The results show that PIXE can measure the total deposited metal in a sample over at least four orders of magnitude with similar fractional uncertainties. The technique is also sensitive enough to observe the variations in alloy composition due to sample nonuniformity or variations in deposition parameters.

  19. X-ray nanodiffraction analysis of stress oscillations in a W thin film on through-silicon via

    Science.gov (United States)

    Todt, J.; Hammer, H.; Sartory, B.; Burghammer, M.; Kraft, J.; Daniel, R.; Keckes, J.; Defregger, S.

    2016-01-01

    Synchrotron X-ray nanodiffraction is used to analyse residual stress distributions in a 200 nm-thick W film deposited on the scalloped inner wall of a through-silicon via. The diffraction data are evaluated using a novel dedicated methodology which allows the quantification of axial and tangential stress components under the condition that radial stresses are negligible. The results reveal oscillatory axial stresses in the range of ∼445–885 MPa, with a distribution that correlates well with the scallop wavelength and morphology, as well as nearly constant tangential stresses of ∼800 MPa. The discrepancy with larger stress values obtained from a finite-element model, as well as from a blanket W film, is attributed to the morphology and microstructural nature of the W film in the via. PMID:26937239

  20. Molecular Packing Structure of Mesogenic Octa-Hexyl Substituted Phthalocyanine Thin Film by X-ray Diffraction Analysis.

    Science.gov (United States)

    Ohmori, Masashi; Higashi, Takuya; Fujii, Akihiko; Ozaki, Masanori

    2016-04-01

    The molecular packing structure in a thin film of the liquid crystalline phthalocyanine, 1,4,8,11,15,18,22,25-octahexylphthalocyanine (C6PcH2), which is a promising small-molecular material for solution-processable organic thin-film solar cells, has been investigated by X-ray diffraction (XRD) measurement. The crystal structure of C6PcH2 in the spin-coated film was determined to be a centered rectangular structure (a = 36.4 Å, b = 20.3 Å). The tilt angle of the phthalocyanine core normal vector was 34-39° from the column axis, and the shortest intermolecular distance was 3.9-4.0 A. The crystal structure determined by XRD analysis was ascertained to be consistent with that calculated by Fourier analvsis.

  1. Soft x-ray free-electron laser imaging by LiF crystal and film detectors over a wide range of fluences.

    Science.gov (United States)

    Pikuz, Tatiana A; Faenov, Anatoly Ya; Fukuda, Yuji; Kando, Masaki; Bolton, Paul; Mitrofanov, Alexander; Vinogradov, Alexander V; Nagasono, Mitsuru; Ohashi, Haruhiko; Yabashi, Makina; Tono, Kensuke; Senba, Yasunori; Togashi, Tadashi; Ishikawa, Tetsuya

    2013-01-20

    LiF crystal and film detectors were used to measure the far-field fluence profile of a self-amplified spontaneous-emission free-electron laser beam and diffraction imaging with high spatial resolution. In these measurements the photoluminescence (PL) response of LiF crystal and film was compared over a wide range of soft x-ray fluences. It was found that the soft x-ray fluence dependences of LiF crystal and film differ. At low fluence, the LiF crystal shows higher PL response compared to LiF film, while this comparison is the opposite at higher fluence. Accurate measurement of LiF crystal and film PL response is important for precise characterization of the spatial, spectral, and coherence features of x-ray beams across the full profile and in localized areas. For such measurements, crucial LiF detector attributes are high spatial resolution and high dynamic range.

  2. Investigation of the structure of human dental tissue at multiple length scales using high energy synchrotron X-ray SAXS/WAXS

    Science.gov (United States)

    Sui, Tan; Landini, Gabriel; Korsunsky, Alexander M.

    2011-10-01

    High energy (>50keV) synchrotron X-ray scattering experiments were carried out on beamline I12 JEEP at the Diamond Light Source (DLS, Oxford, UK). Although a complete human tooth could be studied, in the present study attention was focused on coupons from the region of the Dentin-Enamel Junction (DEJ). Simultaneous high energy SAXS/WAXS measurements were carried out. Quantitative analysis of the results allows multiple length scale characterization of the nano-crystalline structure of dental tissues. SAXS patterns analysis provide insight into the mean thickness and orientation of hydroxyapatite particles, while WAXS (XRD) patterns allow the determination of the crystallographic unit cell parameters of the hydroxyapatite phase. It was found that the average particle thickness determined from SAXS interpretation varies as a function of position in the vicinity of the DEJ. Most mineral particles are randomly orientated within dentin, although preferred orientation emerges and becomes stronger on approach to the enamel. Within the enamel, texture is stronger than anywhere in the dentin, and the determination of lattice parameters can be accomplished by Pawley refinement of the multiple peak diffraction pattern. The results demonstrate the feasibility of using high energy synchrotron X-ray beams for the characterization of human dental tissues. This opens up the opportunity of studying thick samples (e.g., complete teeth) in complex sample environments (e.g., under saline solution). This opens new avenues for the application of high energy synchrotron X-ray scattering to dental research.

  3. Real time in situ x-ray topographic observation of deformation of single crystals and thin films

    Energy Technology Data Exchange (ETDEWEB)

    Zhao, Z.B.; Hershberger, J.; Chiaramonti, A.; Bilello, J.C. [Univ. of Michigan, Ann Arbor, MI (United States); Rek, Z.U. [Stanford Univ., CA (United States). Stanford Synchrotron Radiation Lab.

    1998-12-31

    An experimental apparatus, which is capable of performing real time in situ X-ray topographic observation of deformation process via synchrotron white beam topography, has been developed. This device enables both tensile data (load-displacement) and topographic images to be recorded simultaneously. It has been utilized to study the deformation behaviors of crystals of Mo and W. These specimens have been subject to mechanical cycling with increasing load, and their deformation processes have been observed in real time and in situ via x-ray topography. This leads to the observation of several phenomena, which would have been difficult to reveal by other experimental techniques. They include stress concentration, microyielding, reversible variation of contrasts and stress relaxation. In addition, the deformation behaviors of small angle grain boundaries have also been examined. Furthermore, the specimens can be heated through a heating device attached to the tensile stage, which allows high temperature topography to be performed in real time. The technique has been applied to the Ta films on Si (100) substrates. With increasing temperature, the topographic observations have revealed that the Ta films yields, fracture and then proceed to delaminate from their substrates.

  4. X-ray magnetic circular dichroism study of Dy-doped Bi2Te3 topological insulator thin films

    Science.gov (United States)

    Figueroa, A. I.; Baker, A. A.; Harrison, S. E.; Kummer, K.; van der Laan, G.; Hesjedal, T.

    2017-01-01

    Magnetic doping of topological insulators (TIs) is crucial for unlocking novel quantum phenomena, paving the way for spintronics applications. Recently, we have shown that doping with rare earth ions introduces large magnetic moments and allows for high doping concentrations without the loss of crystal quality, however no long range magnetic order was observed. In Dy-doped Bi2Te3 we found a band gap opening above a critical doping concentration, despite the paramagnetic bulk behavior. Here, we present a surface-sensitive x-ray magnetic circular dichroism (XMCD) study of an in situ cleaved film in the cleanest possible environment. The Dy M4,5 absorption spectra measured with circularly polarized x-rays are fitted using multiplet calculations to obtain the effective magnetic moment. Arrott-Noakes plots, measured by the Dy M5 XMCD as a function of field at low temperatures, give a negative transition temperature. The evaporation of a ferromagnetic Co thin film did not introduce ferromagnetic ordering of the Dy dopants either; instead a lowering of the transition temperature was observed, pointing towards an antiferromagnetic ordering scenario. This result shows that there is a competition between the magnetic exchange interaction and the Zeeman interaction. The latter favors the Co and Dy magnetic moments to be both aligned along the direction of the applied magnetic field, while the exchange interaction is minimized if the Dy and Co atoms are antiferromagnetically coupled, as in zero applied field.

  5. Study of coercive fields and Kβ/Kα X-ray intensity ratios of nickel films in the thickness range of 5-2000 nm

    Science.gov (United States)

    Prajapat, C. L.; Singh, M. R.; Ravikumar, G.; Gupta, S. K.; Joseph, D.; Nayak, B. K.; Saxena, A.

    2012-06-01

    Coercive fields and X-Ray intensity ratios of the K-series lines of Ni films in the thickness range of 5-2000 nm deposited onto Si (111) substrate have been studied. The Coercive field is observed to increase with thickness and follows power law for the thickness range ≥ 50 nm. For lower thickness, there is a deviation from power law. A correlated change is also observed in the Kβ/Kα X-ray intensity ratios.

  6. On revealing the vertical structure of nanoparticle films with elemental resolution: A total external reflection X-ray standing waves study

    Energy Technology Data Exchange (ETDEWEB)

    Zargham, Ardalan, E-mail: zargham@ifp.uni-bremen.d [Institute of Solid State Physics, University of Bremen, Otto-Hahn-Allee 1, 28359 Bremen (Germany); Schmidt, Thomas; Flege, Jan Ingo; Sauerbrey, Marc; Hildebrand, Radowan [Institute of Solid State Physics, University of Bremen, Otto-Hahn-Allee 1, 28359 Bremen (Germany); Roehe, Sarah; Baeumer, Marcus [Applied and Physical Chemistry, University of Bremen, Leobener Str. 2, 28359, Bremen (Germany); Falta, Jens [Institute of Solid State Physics, University of Bremen, Otto-Hahn-Allee 1, 28359 Bremen (Germany)

    2010-02-15

    We present a promising combination of methods to precisely determine the morphology of nanostructures, drawing on the example of monodisperse CoPt{sub 3} nanoparticle films deposited by spin coating and dip coating techniques on functionalized Au substrates. Ex-situ X-ray standing waves in total external reflection combined with X-ray reflectivity measurements were employed to determine element-specific atomic-density distributions in vertical direction.

  7. Monitoring the Phase Formation of Coevaporated Lead Halide Perovskite Thin Films by in Situ X-ray Diffraction.

    Science.gov (United States)

    Pistor, Paul; Borchert, Juliane; Fränzel, Wolfgang; Csuk, René; Scheer, Roland

    2014-10-02

    Perovskite solar cells based on (CH3NH3)Pb(I,Cl)3 have recently demonstrated rapidly increasing cell efficiencies. Here, we show progress identifying phases present during the growth of (CH3NH3)Pb(I,Cl)3 perovskite thin films with the vacuum-based coevaporation approach using two sources under varying deposition conditions. With in situ X-ray diffraction, crystalline phases can be identified and monitored in real time. For different (CH3NH3)I-to-PbCl2 flux ratios, two distinct (CH3NH3)Pb(IxCl(1-x))3 phases with high (x > 0.95) and with lower (x perovskite film to PbI2 at temperatures above 200 °C.

  8. Quantifying point defects in Cu2ZnSn(S,Se)4 thin films using resonant x-ray diffraction

    Energy Technology Data Exchange (ETDEWEB)

    Stone, Kevin H. [Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA; Christensen, Steven T. [National Renewable Energy Laboratory, Golden, Colorado 80401, USA; Harvey, Steven P. [National Renewable Energy Laboratory, Golden, Colorado 80401, USA; Teeter, Glenn [National Renewable Energy Laboratory, Golden, Colorado 80401, USA; Repins, Ingrid L. [National Renewable Energy Laboratory, Golden, Colorado 80401, USA; Toney, Michael F. [Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA

    2016-10-17

    Cu 2ZnSn(S,Se)4 is an interesting, earth abundant photovoltaic material, but has suffered from low open circuit voltage. To better understand the film structure, we have measured resonant x-ray diffraction across the Cu and Zn K-edges for the device quality thin films of Cu 2ZnSnS4 (8.6% efficiency) and Cu 2ZnSn(S,Se)4 (3.5% efficiency). This approach allows for the confirmation of the underlying kesterite structure and quantification of the concentration of point defects and vacancies on the Cu, Zn, and Sn sublattices. Rietveld refinement of powder diffraction data collected at multiple energies is used to determine that there exists a high level of Cu Zn and Zn Cu defects on the 2c and 2d Wyckoff positions. We observe a significantly lower concentration of Zn Sn defects and Cu or Zn vacancies.

  9. Self-ordering of random intercalates in thin films of cuprate superconductors: Growth model and x-ray diffraction diagnosis

    Science.gov (United States)

    Ariosa, D.; Cancellieri, C.; Lin, P. H.; Pavuna, D.

    2007-05-01

    We propose a simple model for the nucleation of random intercalates during the growth of high-temperature superconductor (HTSC) films by pulsed laser deposition (PLD). The model predicts a very particular spatial distribution of defects: a Markovian-like sequence of displacements along the growth direction ( c axis), as well as a two-component in-plane correlation function, characteristic of self-organized intercalates. A model for x-ray diffraction (XRD) on such structures is also developed and accounts for both c -axis and in-plane anomalies observed in XRD experiments. The method presented in this work constitutes a useful characterization tool in the optimization of deposition parameters for the growth of HTSC films.

  10. Quantifying point defects in Cu2ZnSn(S,Se)4 thin films using resonant x-ray diffraction

    Science.gov (United States)

    Stone, Kevin H.; Christensen, Steven T.; Harvey, Steven P.; Teeter, Glenn; Repins, Ingrid L.; Toney, Michael F.

    2016-10-01

    Cu2ZnSn(S,Se)4 is an interesting, earth abundant photovoltaic material, but has suffered from low open circuit voltage. To better understand the film structure, we have measured resonant x-ray diffraction across the Cu and Zn K-edges for the device quality thin films of Cu2ZnSnS4 (8.6% efficiency) and Cu2ZnSn(S,Se)4 (3.5% efficiency). This approach allows for the confirmation of the underlying kesterite structure and quantification of the concentration of point defects and vacancies on the Cu, Zn, and Sn sublattices. Rietveld refinement of powder diffraction data collected at multiple energies is used to determine that there exists a high level of CuZn and ZnCu defects on the 2c and 2d Wyckoff positions. We observe a significantly lower concentration of ZnSn defects and Cu or Zn vacancies.

  11. Sulfur X-ray absorption fine structure in porous Li–S cathode films measured under argon atmospheric conditions

    Energy Technology Data Exchange (ETDEWEB)

    Müller, Matthias, E-mail: matthias.mueller@ptb.de [Physikalisch-Technische Bundesanstalt, Abbestr. 2-12, 10587 Berlin (Germany); Choudhury, Soumyadip [Leibniz-Institut für Polymerforschung, Hohe Strasse 6, 01069 Dresden (Germany); Technische Universität Dresden, Physical Chemistry of Polymeric Materials ,01062 Dresden (Germany); Gruber, Katharina [VARTA Micro Innovation GmbH, Stremayrgasse 9, 8010 Graz (Austria); Cruz, Valene B. [Universität Ulm, Institut für Elektrochemie, 89069 Ulm (Germany); Helmholtz-Institut Ulm (HIU), 89069 Ulm (Germany); Fuchsbichler, Bernd [VARTA Micro Innovation GmbH, Stremayrgasse 9, 8010 Graz (Austria); Jacob, Timo [Universität Ulm, Institut für Elektrochemie, 89069 Ulm (Germany); Helmholtz-Institut Ulm (HIU), 89069 Ulm (Germany); Koller, Stefan [VARTA Micro Innovation GmbH, Stremayrgasse 9, 8010 Graz (Austria); Stamm, Manfred [Leibniz-Institut für Polymerforschung, Hohe Strasse 6, 01069 Dresden (Germany); Technische Universität Dresden, Physical Chemistry of Polymeric Materials ,01062 Dresden (Germany); Ionov, Leonid [Leibniz-Institut für Polymerforschung, Hohe Strasse 6, 01069 Dresden (Germany); Beckhoff, Burkhard [Physikalisch-Technische Bundesanstalt, Abbestr. 2-12, 10587 Berlin (Germany)

    2014-04-01

    In this paper we present the first results for the characterization of highly porous cathode materials with pore sizes below 1 μm for Lithium Sulfur (Li–S) batteries by Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy. A novel cathode material of porous carbon films fabricated with colloidal array templates has been investigated. In addition, an electrochemical characterization has been performed aiming on an improved correlation of physical and chemical parameters with the electrochemical performance. The performed NEXAFS measurements of cathode materials allowed for a chemical speciation of the sulfur content inside the cathode material. The aim of the presented investigation was to evaluate the potential of the NEXAFS technique to characterize sulfur in novel battery material. The long term goal for the characterization of the battery materials is the sensitive identification of undesired side reactions, such as the polysulfide shuttle, which takes place during charging and discharging of the battery. The main drawback associated with the investigation of these materials is the fact that NEXAFS measurements can usually only be performed ex situ due to the limited in situ instrumentation being available. For Li–S batteries this problem is more pronounced because of the low photon energies needed to study the sulfur K absorption edge at 2472 eV. We employed 1 μm thick Si{sub 3}N{sub 4} windows to construct sealed argon cells for NEXAFS measurements under ultra high vacuum (UHV) conditions as a first step towards in situ measurements. The cells keep the sample under argon atmosphere at any time and the X-ray beam passes mainly through vacuum which enables the detection of the low energy X-ray emission of sulfur. Using these argon cells we found indications for the presence of lithium polysulfides in the cathode films whereas the correlations to the offline electrochemical results remain somewhat ambiguous. As a consequence of these findings one

  12. Technical Note: Nanometric organic photovoltaic thin film detectors for dose monitoring in diagnostic x-ray imaging

    Energy Technology Data Exchange (ETDEWEB)

    Elshahat, Bassem [Medical Physics Program, Department of Physics and Applied Physics, University of Massachusetts Lowell, Lowell, Massachusetts 01854 and Department of Medical Imaging, Royal Jubilee Hospital, Vancouver Island Health Authority, Victoria, British Columbia V8R 1J8 (Canada); Gill, Hardeep Singh; Kumar, Jayant [Department of Physics and Applied Physics, University of Massachusetts Lowell, Lowell, Massachusetts 01854 (United States); Filipyev, Ilya; Zygmanski, Piotr [Harvard Medical School, Dana Farber Cancer Institute and Brigham and Women’s Hospital, Boston, Massachusetts 02215 (United States); Shrestha, Suman; Karellas, Andrew [Department of Radiology, University of Massachusetts Medical School, Worcester, Massachusetts 01655 (United States); Hesser, Jürgen [Department of Radiation Oncology, University Medical Center Mannheim, Heidelberg University, Theodor-Kutzer-Ufer 1-3, Mannheim 68167 (Germany); Sajo, Erno [Medical Physics Program, Department of Physics and Applied Physics, University of Massachusetts Lowell, Lowell, Massachusetts 01854 (United States)

    2015-07-15

    Purpose: To fabricate organic photovoltaic (OPV) cells with nanometric active layers sensitive to ionizing radiation and measure their dosimetric characteristics in clinical x-ray beams in the diagnostic tube potential range of 60–150 kVp. Methods: Experiments were designed to optimize the detector’s x-ray response and find the best parameter combination by changing the active layer thickness and the area of the electrode. The OPV cell consisted of poly (3-hexylthiophene-2,5-diyl): [6,6]-phenyl C{sub 61} butyric acid methyl ester photoactive donor and acceptor semiconducting organic materials sandwiched between an aluminum electrode as an anode and an indium tin oxide electrode as a cathode. The authors measured the radiation-induced electric current at zero bias voltage in all fabricated OPV cells. Results: The net OPV current as a function of beam potential (kVp) was proportional to kVp{sup −0.5} when normalized to x-ray tube output, which varies with kVp. Of the tested configurations, the best combination of parameters was 270 nm active layer thicknesses with 0.7 cm{sup 2} electrode area, which provided the highest signal per electrode area. For this cell, the measured current ranged from approximately 0.7 to 2.4 nA/cm{sup 2} for 60–150 kVp, corresponding to about 0.09 nA–0.06 nA/mGy air kerma, respectively. When compared to commercial amorphous silicon thin film photovoltaic cells irradiated under the same conditions, this represents 2.5 times greater sensitivity. An additional 40% signal enhancement was observed when a 1 mm layer of plastic scintillator was attached to the cells’ beam-facing side. Conclusions: Since both OPVs can be produced as flexible devices and they do not require external bias voltage, they open the possibility for use as thin film in vivo detectors for dose monitoring in diagnostic x-ray imaging.

  13. X-ray diffraction study of the reverse martensitic transformation in NiTi shape memory thin films

    Energy Technology Data Exchange (ETDEWEB)

    Koker, M.K.A. [Max Planck Institute for Intelligent Systems (formerly Max Planck Institute for Metals Research), Heisenbergstraße 3, D-70569 Stuttgart (Germany); Schaab, J. [University of Stuttgart, Institute for Materials Science, Heisenbergstraße 3, D-70569 Stuttgart (Germany); Zotov, N., E-mail: n.zotov@is.mpg.de [Max Planck Institute for Intelligent Systems (formerly Max Planck Institute for Metals Research), Heisenbergstraße 3, D-70569 Stuttgart (Germany); Mittemeijer, E.J. [Max Planck Institute for Intelligent Systems (formerly Max Planck Institute for Metals Research), Heisenbergstraße 3, D-70569 Stuttgart (Germany); University of Stuttgart, Institute for Materials Science, Heisenbergstraße 3, D-70569 Stuttgart (Germany)

    2013-10-31

    The development of stresses, phase fractions and the microstructure of thin equiatomic NiTi substrate-bound films was investigated during the reverse transformation from martensite to austenite. Synchrotron X-ray diffraction (XRD) experiments were performed during the heating portion of thermal cycling applied to the thin films to capture, in particular, the reverse martensitic phase transformation (monoclinic martensite → cubic austenite). The phase fractions and microstructure, as a function of temperature and thermal cycling, were analyzed through the application of Rietveld refinement to the diffraction data. Further, using the XRD data, the overall macroscopic stress in the film (derived from the curvature of the film/substrate system determined by XRD rocking curve measurements) and the stress in the austenite phase (derived from the lattice strain) during the transformation were tracked as a function of the degree of the transformation. The state of the stress in the austenite was found to remain biaxially, rotationally symmetric, even in the two-phase (martensite and austenite) film. The developments of the total stress in the film and the stresses in each of the two phases are discussed in terms of the transformation-induced volume misfit and its accommodation by elastic deformation. - Highlights: • The martensite crystallite size remains constant as a function of temperature. • The austenite crystallite size suggests heterogeneous nucleation and growth. • Strongly anisotropic microstrain in the martensite phase. • The state of stress in the austenite is biaxially rotationally symmetric. • Thermal lag between macroscopic stress and austenite phase fraction.

  14. Observation of in situ oxidation dynamics of vanadium thin film with ambient pressure X-ray photoemission spectroscopy

    Science.gov (United States)

    Kim, Geonhwa; Yoon, Joonseok; Yang, Hyukjun; Lim, Hojoon; Lee, Hyungcheol; Jeong, Changkil; Yun, Hyungjoong; Jeong, Beomgyun; Crumlin, Ethan; Lee, Jouhahn; Lee, Jaeyoung; Ju, Honglyoul; Mun, Bongjin Simon

    2016-11-01

    The evolution of oxidation/reduction states of vanadium oxide thin film was monitored in situ as a function of oxygen pressure and temperature via ambient pressure X-ray photoemission spectroscopy. Spectra analysis showed that VO2 can be grown at a relatively low temperature, T ˜ 523 K, and that V2O5 oxide develops rapidly at elevated oxygen pressure. Raman spectroscopy was applied to confirm the formation of VO2 oxide inside of the film. In addition, the temperature-dependent resistivity measurement on the grown thin film, e.g., 20 nm exhibited a desirable metal-insulator transition of VO2 with a resistivity change of ˜1.5 × 103 times at 349.3 K, displaying typical characteristics of thick VO2 film, e.g., 100 nm thick. Our results not only provide important spectroscopic information for the fabrication of vanadium oxides, but also show that high quality VO2 films can be formed at relatively low temperature, which is highly critical for engineering oxide film for heat-sensitive electronic devices.

  15. Investigation of the amorphous to crystalline phase transition of chemical solution deposited Pb(Zr30Ti70)O3 thin films by soft x-ray absorption and soft x-ray emission spectroscopy

    Energy Technology Data Exchange (ETDEWEB)

    Schneller, T.; Schneller, T.; Kohlstedt, H.; Petraru, A.; Waser, R.; Guo, J.; Denlinger, J.; Learmonth, T.; Glans, Per-Andres; Smith, K. E.

    2008-08-01

    Chemical solution deposited (CSD) complex oxide thin films attract considerable interest in various emerging fields as for example, fuel cells, ferroelectric random access memories or coated conductors. In the present paper the results of soft-x-ray spectroscopy between 100 eV and 500 eV on the amorphous to crystalline phase transition of ferroelectric PbZr{sub 0.3}Ti{sub 0.7}O{sub 3} (PZT) thin films are presented. Five CSD samples derived from the same wafer coated with a PZT film pyrolyzed at 350 C were heat treated at different temperatures between 400 C and 700 C. At first the sample were morphologically and electrically characterized. Subsequently the soft-x-ray absorption and emission experiments were performed at the undulator beamline 8.0 of the Advanced Light Source of the Lawrence Berkeley National Laboratory. Soft-x-ray absorption spectra were acquired for the Ti L{sub 2,3-}, O K-, and C K-edge thresholds by using simultaneously the total electron yield (TEY) and total fluorescence yield (TFY) detection methods. For two samples, annealed at 400 C and 700 C, respectively, the resonant inelastic soft-x-ray spectroscopy (RIXS) was applied for various excitation energies near the Ti L-, O K-edges. We observed clear evidence of a rutile phase at untypically low temperatures. This rutile phase transforms into the perovskite phase upon increasing annealing temperature. These results are discussed in the framework of current microscopic models of the PZT (111) texture selection.

  16. Ionizing radiation regulations and the dental practitioner: 2. Regulations for the use of X-rays in dentistry.

    Science.gov (United States)

    Rout, John; Brown, Jackie

    2012-05-01

    The first article in this series covered radiation hazards and protection. To minimize the potential harmful effects of X-rays, legislation has been introduced by a number of countries including the European Union.

  17. Correcting and coating thin walled X-ray Optics via a combination of controlled film deposition and magnetic smart materials

    Science.gov (United States)

    Ulmer, Melville

    The project goal is to demonstrate that thin walled (price. Since the desired surface area for the next generation X-ray telescope is >10x that of Chandra, the >10x requirement is then for >200 m^2 of surface area with a surface finish of better than 0.5 nm. Therefore, replication of some sort is called for. Because no replication technology has been shown to achieve ≤1" angular resolution, post fabrication figure corrections are likely going to be necessary. Some have proposed to do this in orbit and others prelaunch including us. Our prelaunch approach is to apply in-plane stresses to the thin walled mirror shells via a magnetic field. The field will be held in by some magnetically hard material such as NiCo. By use of a so called magnetic smart material (MSM) such as Terfenol-D, we already shown that strong enough stresses can be generated. Preliminary work has also shown that the magnetic field can be held in well enough to apply the figure correcting stresses pre-launch. What we call "set-it and forget-it." However, what is unique about our approach is that at the cost of complexity and some areal coverage, our concept will also accommodate in-orbit adjustments. Furthermore, to the best of our knowledge ours is one of two known stress modification processes that are bi-axial. Our plan is first to validate set-it and forget-it first on cantilevers and then to expand this to working on 5 cm x 5 cm pieces. We will work both with NiCo and glass or Si coated with Terfenol-D. Except for the NiCo, substrates we will also coat the samples with NiCo in order to have a film that will hold in the magnetic field. As part of the coating process, we will control the stress of the film by varying the voltage bias while coating. The bias stress control can be used to apply films with minimal stress such as Terfenol-D and X-ray reflecting coatings such as Ir. Ir is a highly desirable coating for soft X-ray astronomy mirrors that can have significant built in stress unless

  18. Properties of thin film radiation detectors and their application to dosimetry and quality assurance in x-ray imaging

    Science.gov (United States)

    Elshahat, Bassem

    The characteristics of two different types of thin-film radiation detectors are experimentally investigated: organic photovoltaic cells (OPV) and a new self-powered detector that operates based on high-energy secondary electrons (HEC). Although their working principles are substantially different, they both can be used for radiation detection and image formation in medical applications. OPVs with different active layer material thicknesses and aluminum electrode areas were fabricated. The OPV cell consisted of P3HT: PCBM photoactive materials, composed of donor and acceptor semiconducting organic materials, sandwiched between an aluminum electrode as anode and an indium tin oxide (ITO) electrode as a cathode. The detectors were exposed to 60150 kVp x rays, which generated photocurrent in the active layer. The electric charge production in the OPV cells was measured. The net current as function of beam energy (kVp) was proportional to ~1/kVp0.45 when adjusted for x-ray beam output. The best combination of parameters for these cells was 270-nm active layer thicknesses for 0.7cm-2 electrode area. The measured current ranged from about 0.7 to 2.4 nA/cm2 for 60-150 kVp, corresponding to about 0.09 -- 0.06 nA/cm2/mGy, respectively, when adjusted for the output x-ray source flux. The HEC detection concept was recently proposed and experimentally demonstrated by a UML/HMS research group. HEC detection employs direct conversion of high-energy electron current to detector signal without external power and amplification. The potential of using HEC detectors for diagnostic imaging application was investigated by using a heterogeneous phantom consisting of a water cylinder with Al and wax rod inserts.

  19. Grazing-incidence small-angle X-ray scattering from thin polymer films with lamellar structures - the scattering cross section in the distorted-wave Born approximation

    DEFF Research Database (Denmark)

    Posselt, Dorthe; Busch, Peter; Rauscher, Markus

    2006-01-01

    Grazing-incidence small-angle X-ray or neutron scattering of thin polymer films reveals information about the ordering and preferential orientations of the phase-separated microdomains within the films. The grazing-incidence geometry enhances the surface sensitivity; however, the scattering has t...

  20. Hard X-ray photoelectron spectroscopy of bulk and thin films of Heusler compounds

    Energy Technology Data Exchange (ETDEWEB)

    Kozina, Xeniya

    2012-03-26

    X-ray photoemission spectroscopy (XPS) is one of the most universal and powerful tools for investigation of chemical states and electronic structures of materials. The application of hard X-rays increases the inelastic mean free path of the emitted electrons within the solid and thus makes hard X-ray photoelectron spectroscopy (HAXPES) a bulk sensitive probe for solid state research and especially a very effective nondestructive technique to study buried layers. This thesis focuses on the investigation of multilayer structures, used in magnetic tunnel junctions (MTJs), by a number of techniques applying HAXPES. MTJs are the most important components of novel nanoscale devices employed in spintronics. The investigation and deep understanding of the mechanisms responsible for the high performance of such devices and properties of employed magnetic materials that are, in turn, defined by their electronic structure becomes feasible applying HAXPES. Thus the process of B diffusion in CoFeB-based MTJs was investigated with respect to the annealing temperature and its influence on the changes in the electronic structure of CoFeB electrodes that clarify the behaviour and huge TMR ratio values obtained in such devices. These results are presented in chapter 6. The results of investigation of the changes in the valence states of buried off-stoichiometric Co{sub 2}MnSi electrodes were investigated with respect to the Mn content {alpha} and its influence on the observed TMR ratio are described in chapter 7. Magnetoelectronic properties such as exchange splitting in ferromagnetic materials as well as the macroscopic magnetic ordering can be studied by magnetic circular dichroism in photoemission (MCDAD). It is characterized by the appearance of an asymmetry in the photoemission spectra taken either from the magnetized sample with the reversal of the photon helicity or by reversal of magnetization direction of the sample when the photon helicity direction is fixed. Though

  1. Determination of band profiles in GaN films using hard X-ray photoelectron spectroscopy

    Science.gov (United States)

    Saito, Shinji; Yoshiki, Masahiko; Nunoue, Shinya; Sano, Nobuyuki

    2017-02-01

    We investigated band-profile control by introducing interlayers between a semiconductor and metal contact layers to improve the electrical properties of GaN-based semiconductor devices. We evaluated the electronic structure of the semiconductor surface and the metal/semiconductor interface by hard X-ray photoelectron spectroscopy. We also performed Monte Carlo simulations using the Boltzmann transport equation under the potential profile obtained using the Poisson equation. The band profile in the semiconductor substrate was then examined by comparing the energy spectra from the simulations with those from the experiments. We obtained good agreement between the two results. The present experimental and theoretical methods allow one to determine the band profile near the surface of a semiconductor as well as that in a metal interface. This approach may become a useful tool in the design and/or evaluation of processing conditions.

  2. Bone X-Ray (Radiography)

    Medline Plus

    Full Text Available ... clothing that might interfere with the x-ray images. Women should always inform their physician and x-ray ... small burst of radiation that passes through the body, recording an image on photographic film or a special detector. Different ...

  3. In situ x-ray diffraction of solution-derived ferroelectric thin films for quantitative phase and texture evolution measurement

    Science.gov (United States)

    Nittala, Krishna; Mhin, Sungwook; Jones, Jacob L.; Robinson, Douglas S.; Ihlefeld, Jon F.; Brennecka, Geoff L.

    2012-11-01

    An in situ measurement technique is developed and presented, which utilizes x-rays from a synchrotron source with a two-dimensional detector to measure thin film microstructural and crystallographic evolution during heating. A demonstration experiment is also shown wherein the measured diffraction patterns are used to describe phase and texture evolution during heating and crystallization of solution-derived thin films. The diffraction images are measured sequentially while heating the thin film with an infrared lamp. Data reduction methodologies and representations are also outlined to extract phase and texture information from the diffraction images as a function of time and temperature. These techniques and data reduction methods are demonstrated during crystallization of solution-derived lead zirconate titanate ferroelectric thin films heated at a rate of 30 °C/min and using an acquisition time of 8 s. During heating and crystallization, a PtxPb type phase was not observed. A pyrochlore phase was observed prior to the formation and growth of the perovskite phase. The final crystallized films are observed to have both 111 and 100 texture components. The in situ measurement methodology developed in this work allows for acquiring diffraction images in times as low as 0.25 s and can be used to investigate changes during crystallization at faster heating rates. Moreover, the experiments are shown to provide unique information during materials processing.

  4. In situ micro-Raman analysis and X-ray diffraction of nickel silicide thin films on silicon.

    Science.gov (United States)

    Bhaskaran, M; Sriram, S; Perova, T S; Ermakov, V; Thorogood, G J; Short, K T; Holland, A S

    2009-01-01

    This article reports on the in situ analysis of nickel silicide (NiSi) thin films formed by thermal processing of nickel thin films deposited on silicon substrates. The in situ techniques employed for this study include micro-Raman spectroscopy (microRS) and X-ray diffraction (XRD); in both cases the variations for temperatures up to 350 degrees C has been studied. Nickel silicide thin films formed by vacuum annealing of nickel on silicon were used as a reference for these measurements. In situ analysis was carried out on nickel thin films on silicon, while the samples were heated from room temperature to 350 degrees C. Data was gathered at regular temperature intervals and other specific points of interest (such as 250 degrees C, where the reaction between nickel and silicon to form Ni(2)Si is expected). The transformations from the metallic state, through the intermediate reaction states, until the desired metal-silicon reaction product is attained, are discussed. The evolution of nickel silicide from the nickel film can be observed from both the microRS and XRD in situ studies. Variations in the evolution of silicide from metal for different silicon substrates are discussed, and these include (100) n-type, (100) p-type, and (110) p-type silicon substrates.

  5. Effects of the Substrate Temperature in AuN Thin Films by Means of X-Ray Diffraction

    Science.gov (United States)

    Devia, A.; Benavides, V.; Castillo, H. A.; Quintero, J.

    2006-12-01

    Gold is used in electronic industry like electric conductor for products such as computers, mobiles phones, etc; with the drawback that it is one of the most expensive metals in the market. Gold Nitride is a new material, having excellent physics properties like high hardness, high melting point, high electric conductivity, chemical inertia and good thermodynamic stabily among others. At the moment its study is more about electronics, optics, mechanical properties and growth of the films. AuN thin films were produced by the PAPVD (Plasma assisted Physics Vapor Deposition) method, using the pulsed arc technique in a mono-vaporizer system. These films were created with an Au target of 99% purity and deposited on stainless steel 304. It was observed that heating the substrate produces small stoichiometric changes in the film, which makes small changes in the diffraction patterns to appear, like widening in the Au orientation, since the composicional gradient is varying according to the substrate temperature. Au 4f and N1s narrow spectra were analyzed using XPS (X-Ray Photoelectron Spectroscopy), in order to observe stoichiometry in the films.

  6. Photo-responsivity characterizations of CdTe films for direct-conversion X-ray detectors

    Energy Technology Data Exchange (ETDEWEB)

    Kim, Ryun Kyung; Cha, Bo Kyung; Jeon, Sung Chae; Seo, Chang Woo [Korea Electrotechnology Research Institute, Ansan (Korea, Republic of); Yun, Seung Man [Pusan National University, Busan (Korea, Republic of)

    2014-08-15

    We have fabricated and investigated thin, polycrystalline, cadmium-telluride (CdTe) films in order to utilize them for optical switching readout layers in direct-conversion X-ray detectors. The polycrystalline CdTe films are fabricated on ITO glasses by using the physical vapor deposition (PVD) method at a slow deposition rate and a pressure of 10{sup -6} torr. CdTe films with thicknesses of 5 and 20 μm are grown. The electrical and the optical characteristics of the CdTe films are investigated by measuring the dark-current and the photo-current as functions of the applied field under different wavelengths of light. Higher photo-currents are generated at the longer wavelengths of light for the same applied voltage. When a higher electrical field is applied to the 20 μm-thick CdTe film, a higher dark-current, a higher photo-current, a larger number of charges, and a higher quantum efficiency are generated.

  7. Quantitative compositional analysis of organic thin films using transmission NEXAFS spectroscopy in an X-ray microscope

    Energy Technology Data Exchange (ETDEWEB)

    Collins, Brian A. [Department of Physics, NCSU, Raleigh, NC 27695-8202 (United States); Ade, Harald, E-mail: harald_ade@ncsu.edu [Department of Physics, NCSU, Raleigh, NC 27695-8202 (United States)

    2012-08-15

    Highlights: Black-Right-Pointing-Pointer Common sources of error in transmission NEXAFS spectra in a STXM identified and shown to be significant. Black-Right-Pointing-Pointer Three facile methods to characterize and eliminate or limit errors are detailed. Black-Right-Pointing-Pointer Appropriate spectra processing methods are discussed and demonstrated. Black-Right-Pointing-Pointer Quantitative compositional analysis of organic thin films is conducted and shown to be robust. -- Abstract: Near edge X-ray absorption fine structure (NEXAFS) spectroscopy is well suited for the quantitative determination of the composition of soft matter thin films. Combined with the high spatial resolution of a scanning transmission X-ray microscope, compositional maps of submicron morphologies can be derived and have been used successfully to characterize a number of materials systems. However, multiple sources of known systematic errors limit the accuracy and are frequently not taken into account. We show that these errors can be significant (more than 10%) and demonstrate simple methods to eliminate them. With suitable precautions, a compositional measurement can be made on a thin film sample in a matter of minutes with sub-micron spatial resolution and sub-percent compositional precision. NEXAFS measurements are furthermore known to be sensitive to anisotropic molecular orientation and a strategy to account for that and extract preferential molecular orientation relative to a reference is presented. The spatial resolution of the measurement can be increased to below 100 nm at the expense of compositional precision, depending on the point spread function of the zone plate focusing optics of the microscope.

  8. Grazing incidence X-ray fluorescence analysis of buried interfaces in periodically structured crystalline silicon thin-film solar cells

    Energy Technology Data Exchange (ETDEWEB)

    Eisenhauer, David; Preidel, Veit; Becker, Christiane [Young Investigator Group Nanostructured Silicon for Photovoltaic and Photonic Implementations (Nano-SIPPE), Helmholtz-Zentrum Berlin fuer Materialien und Energie GmbH, Berlin (Germany); Pollakowski, Beatrix; Beckhoff, Burkhard [Physikalisch-Technische Bundesanstalt, Berlin (Germany); Baumann, Jonas; Kanngiesser, Birgit [Institut fuer Optik und Atomare Physik, Technische Universitaet Berlin (Germany); Amkreutz, Daniel; Rech, Bernd [Institut Silizium Photovoltaik, Helmholtz-Zentrum Berlin fuer Materialien und Energie GmbH, Berlin (Germany); Back, Franziska; Rudigier-Voigt, Eveline [SCHOTT AG, Mainz (Germany)

    2015-03-01

    We present grazing incidence X-ray fluorescence (GIXRF) experiments on 3D periodically textured interfaces of liquid phase crystallized silicon thin-film solar cells on glass. The influence of functional layers (SiO{sub x} or SiO{sub x}/SiC{sub x}) - placed between glass substrate and silicon during crystallization - on the final carbon and oxygen contaminations inside the silicon was analyzed. Baring of the buried structured silicon surface prior to GIXRF measurement was achieved by removal of the original nano-imprinted glass substrate by wet-chemical etching. A broad angle of incidence distribution was determined for the X-ray radiation impinging on this textured surface. Optical simulations were performed in order to estimate the incident radiation intensity on the structured surface profile considering total reflection and attenuation effects. The results indicate a much lower contamination level for SiO{sub x} compared to the SiO{sub x}/SiC{sub x} interlayers, and about 25% increased contamination when comparing structured with planar silicon layers, both correlating with the corresponding solar cell performances. (copyright 2015 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim)

  9. Band gap states in nanocrystalline WO3 thin films studied by soft x-ray spectroscopy and optical spectrophotometry

    Science.gov (United States)

    Johansson, M. B.; Kristiansen, P. T.; Duda, L.; Niklasson, G. A.; Österlund, L.

    2016-11-01

    Nanocrystalline tungsten trioxide (WO3) thin films prepared by DC magnetron sputtering have been studied using soft x-ray spectroscopy and optical spectrophotometry. Resonant inelastic x-ray scattering (RIXS) measurements reveal band gap states in sub-stoichiometric γ-WO3-x with x  =  0.001-0.005. The energy positions of these states are in good agreement with recently reported density functional calculations. The results were compared with optical absorption measurements in the near infrared spectral region. An optical absorption peak at 0.74 eV is assigned to intervalence transfer of polarons between W sites. A less prominent peak at energies between 0.96 and 1.16 eV is assigned to electron excitation of oxygen vacancies. The latter results are supported by RIXS measurements, where an energy loss in this energy range was observed, and this suggests that electron transfer processes involving transitions from oxygen vacancy states can be observed in RIXS. Our results have implications for the interpretation of optical properties of WO3, and the optical transitions close to the band gap, which are important in photocatalytic and photoelectrochemical applications.

  10. Band gap states in nanocrystalline WO3 thin films studied by soft x-ray spectroscopy and optical spectrophotometry.

    Science.gov (United States)

    Johansson, M B; Kristiansen, P T; Duda, L; Niklasson, G A; Österlund, L

    2016-11-30

    Nanocrystalline tungsten trioxide (WO3) thin films prepared by DC magnetron sputtering have been studied using soft x-ray spectroscopy and optical spectrophotometry. Resonant inelastic x-ray scattering (RIXS) measurements reveal band gap states in sub-stoichiometric γ-WO3-x with x  =  0.001-0.005. The energy positions of these states are in good agreement with recently reported density functional calculations. The results were compared with optical absorption measurements in the near infrared spectral region. An optical absorption peak at 0.74 eV is assigned to intervalence transfer of polarons between W sites. A less prominent peak at energies between 0.96 and 1.16 eV is assigned to electron excitation of oxygen vacancies. The latter results are supported by RIXS measurements, where an energy loss in this energy range was observed, and this suggests that electron transfer processes involving transitions from oxygen vacancy states can be observed in RIXS. Our results have implications for the interpretation of optical properties of WO3, and the optical transitions close to the band gap, which are important in photocatalytic and photoelectrochemical applications.

  11. X-ray microstructural analysis of nanocrystalline TiZrN thin films by diffraction pattern modeling

    Energy Technology Data Exchange (ETDEWEB)

    Escobar, D. [Laboratorio de Física del Plasma, Universidad Nacional de Colombia Sede Manizales, Km. 9 Vía al Magdalena, Manizales (Colombia); PCM Computacional Applications, Universidad Nacional de Colombia Sede Manizales, Km. 9 Vía al Magdalena, Manizales (Colombia); Ospina, R. [Laboratorio de Física del Plasma, Universidad Nacional de Colombia Sede Manizales, Km. 9 Vía al Magdalena, Manizales (Colombia); Gómez, A.G. [Pontificia Universidad Javeriana Seccional Cali, Facultad de Ingeniería, Departamento de Ciencias de la Ingeniería y la Producción (Colombia); Restrepo-Parra, E., E-mail: erestrepopa@unal.edu.co [Laboratorio de Física del Plasma, Universidad Nacional de Colombia Sede Manizales, Km. 9 Vía al Magdalena, Manizales (Colombia); PCM Computacional Applications, Universidad Nacional de Colombia Sede Manizales, Km. 9 Vía al Magdalena, Manizales (Colombia); Arango, P.J. [Laboratorio de Física del Plasma, Universidad Nacional de Colombia Sede Manizales, Km. 9 Vía al Magdalena, Manizales (Colombia)

    2014-02-15

    A detailed microstructural characterization of nanocrystalline TiZrN thin films grown at different substrate temperatures (T{sub S}) was carried out by X-ray diffraction (XRD). Total diffraction pattern modeling based on more meaningful microstructural parameters, such as crystallite size distribution and dislocation density, was performed to describe the microstructure of the thin films more precisely. This diffraction modeling has been implemented and used mostly to characterize powders, but the technique can be very useful to study hard thin films by taking certain considerations into account. Nanocrystalline films were grown by using the cathodic pulsed vacuum arc technique on stainless steel 316L substrates, varying the temperature from room temperature to 200 °C. Further surface morphology analysis was performed to study the dependence of grain size on substrate temperature using atomic force microscopy (AFM). The crystallite and surface grain sizes obtained and the high density of dislocations observed indicate that the films underwent nanostructured growth. Variations in these microstructural parameters as a function of T{sub S} during deposition revealed a competition between adatom mobility and desorption processes, resulting in a specific microstructure. These films also showed slight anisotropy in their microstructure, and this was incorporated into the diffraction pattern modeling. The resulting model allowed for the films' microstructure during synthesis to be better understood according to the experimental results obtained. - Highlights: • Mobility and desorption competition generates a critical temperature. • A microstructure anisotropy related to the local strain was observed in thin films. • Adatom mobility and desorption influence grain size and microstrain.

  12. Chest X-Ray (Chest Radiography)

    Science.gov (United States)

    ... clothing that might interfere with the x-ray images. Women should always inform their physician and x-ray ... small burst of radiation that passes through the body, recording an image on photographic film or a special detector. Different ...

  13. Characterization of quaternary metal oxide films by synchrotron x-ray fluorescence microprobe

    Energy Technology Data Exchange (ETDEWEB)

    Perry, D.L.; Thompson, A.C.; Russo, R.E. [Ernest Orlando Lawrence Berkeley National Lab., CA (United States)] [and others

    1997-04-01

    A high demand for thin films in industrial technology has been responsible for the creation of new techniques for the fabrication of such films. One highly effective method for the syntheses of variable composition thin films is pulsed-laser deposition (PLD). The technique has a large number of characteristics which make it an attractive approach for making films. It offers rapid deposition rates, congruent material transfer, simple target requirements from which to make the films, in situ multilayer deposition, and no gas composition or pressure requirements. Additionally, the technique can also afford crystalline films and films with novel structures. Pulsed-laser deposition can be used to make films of semiconductors, insulators, high-temperature superconductors, diamond-like films, and piezoelectric materials. Quaternary metal oxides involving calcium, nickel, and potassium have been shown to be quite effective in the catalysis of coal gasification and methane coupling. One approach to incorporating all three of the metal oxides into one phase is the use of laser ablation to prepare films of the catalysts so that they may be used for coatings, smooth surfaces on which to conduct detailed studies of gas-solid interface reactions that are involved in catalytic processes, and other applications. The problem of dissimilar boiling points of the three metal oxides system is overcome, since the laser ablation process effects the volatilization of all three components from the laser target essentially simultaneously. There is strong interest in gaining an understanding of the chemical and morphological aspects of the films that are deposited. Phenomena such as lattice defects and chemical heterogeneity are of interest. The experimental data discussed here are restricted to the matrix homogeneity of the films themselves for films which were void of microparticles.

  14. Skull x-ray

    Science.gov (United States)

    X-ray - head; X-ray - skull; Skull radiography; Head x-ray ... There is low radiation exposure. X-rays are monitored and regulated to provide the minimum amount of radiation exposure needed to produce the image. Most ...

  15. Neck x-ray

    Science.gov (United States)

    X-ray - neck; Cervical spine x-ray; Lateral neck x-ray ... There is low radiation exposure. X-rays are monitored so that the lowest amount of radiation is used to produce the image. Pregnant women and ...

  16. Chest x ray films from construction workers: International Labour Office (ILO 1980) classification compared with routine readings.

    Science.gov (United States)

    Albin, M; Engholm, G; Fröström, K; Kheddache, S; Larsson, S; Swantesson, L

    1992-12-01

    The extent of agreement between International Labour Office (ILO) and clinical readings of chest x ray films from construction workers was studied. From a survey of 5898 workers 258 subjects with a profusion of small opacities of > or = 1/1 and a stratified sample of subjects with profusion ILO profusion category > or = 1/1 were clinically recorded as non-normal for the parenchyma. The proportion of films recorded as pneumoconiotic (or possibly so) was especially low for irregular opacities (22%), but increased with the profusion category (both rounded and irregular) as well as with the size of rounded opacities (p 3/11, q 12/25, r 3/4). Only with the profusion category > or = 2/1 were most of the films recorded as pneumoconiotic. The specificity and sensitivity were highest in the geographical areas where a few clinical readers had assessed many films each. The proportion of false negative clinical reports was low for circumscribed pleural thickening of the chest wall (9%) and diaphragmatic pleural thickening (6%). For calcified pleural changes and for the combination of diffuse pleural thickening and obliteration of the costophrenic angle, false negative reports were absent. The present study shows an unsatisfactory sensitivity for clinical compared with ILO readings as a means for screening the parenchyma of workers with a risk of pneumoconiosis.

  17. Elasticity study of textured barium strontium titanate thin films by X-ray diffraction and laser acoustic waves

    Science.gov (United States)

    Chaabani, Anouar; Njeh, Anouar; Donner, Wolfgang; Klein, Andreas; Hédi Ben Ghozlen, Mohamed

    2017-05-01

    Ba0.65Sr0.35TiO3 (BST) thin films of 300 nm were deposited on Pt(111)/TiO2/SiO2/Si(001) substrates by radio frequency magnetron sputtering. Two thin films with different (111) and (001) fiber textures were prepared. X-ray diffraction was applied to measure texture. The raw pole figure data were further processed using the MTEX quantitative texture analysis software for plotting pole figures and calculating elastic constants and Young’s modulus from the orientation distribution function (ODF) for each type of textured fiber. The calculated elastic constants were used in the theoretical studies of surface acoustics waves (SAW) propagating in two types of multilayered BST systems. Theoretical dispersion curves were plotted by the application of the ordinary differential equation (ODE) and the stiffness matrix methods (SMM). A laser acoustic waves (LAW) technique was applied to generate surface acoustic waves (SAW) propagating in the BST films, and from a recursive process, the effective Young’s modulus are determined for the two samples. These methods are used to extract and compare elastic properties of two types of BST films, and quantify the influence of texture on the direction-dependent Young’s modulus.

  18. Study on the Crystallization of Amorphous Cr-Si-Ni Thin Films Using in situ X-ray Diffraction

    Institute of Scientific and Technical Information of China (English)

    Xianping DONG; Jiansheng WU

    2001-01-01

    Crystallization behavior of amorphous Cr-Si-Ni thin films was investigated by means of high temperature in situ X-ray diffraction measurements. The diffraction spectra were recorded isothermally at temperature between 250 and 750℃. The in situ testing of crystallization enables the direct observation of structure evolution which is dependent on heat treatment.Based on the testing results, the grain sizes of the crystalline phases were compared and phase transition tendency was understood. In the mean time, electrical properties of the films as functions of annealing temperature and time have been studied. The increase of volume fraction of CrSi2 crystallinc phases in the Cr-Si-Ni films leads to the decrease in conductivity of the films.The annealing behavior of temperature coefficient of resistance (TCR) is a result of competition between a negative contribution caused by the weak localization effects in amorphous region and a positive contribution caused by CrSi2 grains. Thus the proper mixture of amorphous and crystalline constituents could result in a final zero TCR.

  19. Fabrication and evaluation of a Gd{sub 2}O{sub 2}S:Tb phosphor screen film for development of a CMOS-based X-ray imaging detector

    Energy Technology Data Exchange (ETDEWEB)

    Park, Ji Koon; Choi, Su Rim; Noh, Si Cheol; Jung, Bong Jae; Choi, Il Hong; Kang, Sang Sik [International University of Korea, Jinju (Korea, Republic of)

    2014-08-15

    In this study, Gd{sub 2}O{sub 2}S:Tb phosphor screen films were fabricated by using a special particle-inbinder sedimentation method. The phosphor particles used in this study were manufactured in two sizes, 2.5-μm and 5-μm. To evaluate luminescence efficiency and the spatial resolution according to the thickness, we fabricated screen films with thicknesses of 120, 150, 170, and 210-μm. The spatial resolution of the fabricated films was assessed by using an edge method to measure the modulation transfer function (MTF). From the experimental results, the spatial resolution of the mammography exposures (low-energy X-ray quality) was better than that of dental radiography (high-energy X-ray quality). Also, with the same film thickness, the screen with 2.5-μm particles had better resolution than the screen with 5.0-μm particles, but it showed about 20% lower resolution than a commercial Gd{sub 2}O{sub 2}S:Tb screen. In the evaluation of the results for the dependence of the spatial resolution on the film's thickness, the 120-μm-thick screen showed the highest resolution, which was similar to that of a commercial screen.

  20. Electronic structure of Al- and Ga-doped ZnO films studied by hard X-ray photoelectron spectroscopy

    Directory of Open Access Journals (Sweden)

    M. Gabás

    2014-01-01

    Full Text Available Al- and Ga-doped sputtered ZnO films (AZO, GZO are semiconducting and metallic, respectively, despite the same electronic valence structure of the dopants. Using hard X-ray photoelectron spectroscopy we observe that both dopants induce a band in the electronic structure near the Fermi level, accompanied by a narrowing of the Zn 3d/O 2p gap in the valence band and, in the case of GZO, a substantial shift in the Zn 3d. Ga occupies substitutional sites, whereas Al dopants are in both substitutional and interstitial sites. The latter could induce O and Zn defects, which act as acceptors explaining the semiconducting character of AZO and the lack of variation in the optical gap. By contrast, mainly substitutional doping is consistent with the metallic-like behavior of GZO.

  1. Band Gap Energy of Chalcopyrite Thin Film Solar Cell Absorbers Determined by Soft X-Ray Emission and Absorption Spectroscopy

    Energy Technology Data Exchange (ETDEWEB)

    Bar, M.; Weinhardt, L.; Pookpanratana, S.; Heske, C.; Nishiwaki, S.; Shafarman, W.; Fuchs, O.; Blum, M.; Yang, W.; Denlinger, J.D.

    2008-05-11

    The chemical and electronic structure of high efficiency chalcopyrite thin film solar cell absorbers significantly differs between the surface and the bulk. While it is widely accepted that the absorber surface exhibits a Cu-poor surface phase with increased band gap (Eg), a direct access to the crucial information of the depth-dependency of Eg is still missing. In this paper, we demonstrate that a combination of x-ray emission and absorption spectroscopy allows a determination of Eg in the surface-near bulk and thus complements the established surface- and bulk-sensitive techniques of Eg determination. As an example, we discuss the determination of Eg for a Cu(In,Ga)Se2 absorber [(1.52 +- 0.20) eV].

  2. Silicidation in Ni/Si thin film system investigated by X-ray diffraction and Auger electron spectroscopy

    Energy Technology Data Exchange (ETDEWEB)

    Abhaya, S. [Materials Science Division, Indira Gandhi Centre for Atomic Research, Kalpakkam 603 102 (India); Amarendra, G. [Materials Science Division, Indira Gandhi Centre for Atomic Research, Kalpakkam 603 102 (India)]. E-mail: amar@igcar.gov.in; Kalavathi, S. [Materials Science Division, Indira Gandhi Centre for Atomic Research, Kalpakkam 603 102 (India); Gopalan, Padma [Materials Science Division, Indira Gandhi Centre for Atomic Research, Kalpakkam 603 102 (India); Kamruddin, M. [Materials Science Division, Indira Gandhi Centre for Atomic Research, Kalpakkam 603 102 (India); Tyagi, A.K. [Materials Science Division, Indira Gandhi Centre for Atomic Research, Kalpakkam 603 102 (India); Sastry, V.S. [Materials Science Division, Indira Gandhi Centre for Atomic Research, Kalpakkam 603 102 (India); Sundar, C.S. [Materials Science Division, Indira Gandhi Centre for Atomic Research, Kalpakkam 603 102 (India)

    2007-02-15

    Silicide formation induced by thermal annealing in Ni/Si thin film system has been investigated using glancing incidence X-ray diffraction (GIXRD) and Auger electron spectroscopy (AES). Silicide formation takes place at 870 K with Ni{sub 2}Si, NiSi and NiSi{sub 2} phases co-existing with Ni. Complete conversion of intermediate silicide phases to the final NiSi{sub 2} phase takes place at 1170 K. Atomic force microscopy measurements have revealed the coalescence of pillar-like structures to ridge-like structures upon silicidation. A comparison of the experimental results in terms of the evolution of various silicide phases is presented.

  3. Electronic structure of Al- and Ga-doped ZnO films studied by hard X-ray photoelectron spectroscopy

    Energy Technology Data Exchange (ETDEWEB)

    Gabás, M.; Ramos Barrado, José R. [Lab. de Materiales and Superficies, Dpto. de Física Aplicada I, Universidad de Málaga, 29071 Málaga (Spain); Torelli, P. [Laboratorio TASC, IOM-CNR, S.S. 14 km 163.5, Basovizza, I-34149 Trieste (Italy); Barrett, N. T. [CEA, DSM/IRAMIS/SPCSI, F-91191 Gif-sur-Yvette Cedex (France); Sacchi, M. [Synchrotron SOLEIL, BP 48, 91192 Gif-sur-Yvette, France and Institut des NanoSciences de Paris, UPMC Paris 06, CNRS UMR 7588, 4 Place Jussieu, 75005 Paris (France)

    2014-01-01

    Al- and Ga-doped sputtered ZnO films (AZO, GZO) are semiconducting and metallic, respectively, despite the same electronic valence structure of the dopants. Using hard X-ray photoelectron spectroscopy we observe that both dopants induce a band in the electronic structure near the Fermi level, accompanied by a narrowing of the Zn 3d/O 2p gap in the valence band and, in the case of GZO, a substantial shift in the Zn 3d. Ga occupies substitutional sites, whereas Al dopants are in both substitutional and interstitial sites. The latter could induce O and Zn defects, which act as acceptors explaining the semiconducting character of AZO and the lack of variation in the optical gap. By contrast, mainly substitutional doping is consistent with the metallic-like behavior of GZO.

  4. Soft X-ray angle-resolved photoemission spectroscopy of heavily boron-doped superconducting diamond films

    Directory of Open Access Journals (Sweden)

    T. Yokoya, T. Nakamura, T. Matushita, T. Muro, H. Okazaki, M. Arita, K. Shimada, H. Namatame, M. Taniguchi, Y. Takano, M. Nagao, T. Takenouchi, H. Kawarada and T. Oguchi

    2006-01-01

    Full Text Available We have performed soft X-ray angle-resolved photoemission spectroscopy (SXARPES of microwave plasma-assisted chemical vapor deposition diamond films with different B concentrations in order to study the origin of the metallic behavior of superconducting diamond. SXARPES results clearly show valence band dispersions with a bandwidth of ~23 eV and with a top of the valence band at gamma point in the Brillouin zone, which are consistent with the calculated valence band dispersions of pure diamond. Boron concentration-dependent band dispersions near the Fermi level (EF exhibit a systematic shift of EF, indicating depopulation of electrons due to hole doping. These SXARPES results indicate that diamond bands retain for heavy boron doping and holes in the diamond band are responsible for the metallic states leading to superconductivity at low temperature. A high-resolution photoemission spectroscopy spectrum near EF of a heavily boron-doped diamond superconductor is also presented.

  5. Magnetism at spinel thin film interfaces probed through soft x-ray spectroscopy techniques

    Energy Technology Data Exchange (ETDEWEB)

    Chopdekar, R.V.; Liberati, M.; Takamura, Y.; Kourkoutis, L. Fitting; Bettinger, J. S.; Nelson-Cheeseman, B. B.; Arenholz, E.; Doran, A.; Scholl, A.; Muller, D. A.; Suzuki, Y.

    2009-12-16

    Magnetic order and coupling at the interfaces of highly spin polarized Fe{sub 3}O{sub 4} heterostructures have been determined by surface sensitive and element specific soft x-ray spectroscopy and spectromicroscopy techniques. At ambient temperature, the interface between paramagnetic CoCr{sub 2}O{sub 4} or MnCr{sub 2}O{sub 4} and ferrimagnetic Fe{sub 3}O{sub 4} isostructural bilayers exhibits long range magnetic order of Co, Mn and Cr cations which cannot be explained in terms of the formation of interfacial MnFe{sub 2}O{sub 4} or CoFe{sub 2}O{sub 4}. Instead, the ferrimagnetism is induced by the adjacent Fe{sub 3}O{sub 4} layer and is the result of the stabilization of a spinel phase not achievable in bulk form. Magnetism at the interface region is observable up to 500 K, far beyond the chromite bulk Curie temperature of 50-95 K.

  6. Strains in Thermally Growing Alumina Films Measured in-situ usingSynchrotron X-rays

    Energy Technology Data Exchange (ETDEWEB)

    Hou, P.Y.; Paulikas, A.P.; Veal, B.W.

    2006-01-02

    Strains in thermally grown oxides have been measured in-situ, as the oxides develop and evolve. Extensive data have been acquired from oxides grown in air at elevated temperatures on different model alloys that form Al{sub 2}O{sub 3}. Using synchrotron x-rays at the Advanced Photon Source (Beamline 12BM, Argonne National Laboratory), Debye-Scherrer diffraction patterns from the oxidizing specimen were recorded every 5 minutes during oxidation and subsequent cooling. The diffraction patterns were analyzed to determine strains in the oxides, as well as phase changes and the degree of texture. To study a specimen's response to stress perturbation, the oxidizing temperature was quickly cooled from 1100 to 950 C to impose a compressive thermal stress in the scale. This paper describes this new experimental approach and gives examples from oxidized {beta}-NiAl, Fe-20Cr-10Al, Fe-28Al-5Cr and H{sub 2}-annealed Fe-28Al-5Cr (all at. %) alloys to illustrate some current understanding of the development and relaxation of growth stresses in Al{sub 2}O{sub 3}.

  7. Bone X-Ray (Radiography)

    Medline Plus

    Full Text Available ... x-ray images were maintained on large film sheets (much like a large photographic negative). Today, most ... accredited facilities database . This website does not provide cost information. The costs for specific medical imaging tests, ...

  8. Performance of a gaseous detector based energy dispersive X-ray fluorescence imaging system: Analysis of human teeth treated with dental amalgam

    Energy Technology Data Exchange (ETDEWEB)

    Silva, A.L.M. [I3N, Physics Dept, University of Aveiro, 3810-193 Aveiro (Portugal); Figueroa, R.; Jaramillo, A. [Physics Department, Universidad de La Frontera, Temuco (Chile); Carvalho, M.L. [Atomic Physics Centre, University of Lisbon, 1649-03 Lisboa (Portugal); Veloso, J.F.C.A., E-mail: joao.veloso@ua.pt [I3N, Physics Dept, University of Aveiro, 3810-193 Aveiro (Portugal)

    2013-08-01

    Energy dispersive X-ray fluorescence (EDXRF) imaging systems are of great interest in many applications of different areas, once they allow us to get images of the spatial elemental distribution in the samples. The detector system used in this study is based on a micro patterned gas detector, named Micro-Hole and Strip Plate. The full field of view system, with an active area of 28 × 28 mm{sup 2} presents some important features for EDXRF imaging applications, such as a position resolution below 125 μm, an intrinsic energy resolution of about 14% full width at half maximum for 5.9 keV X-rays, and a counting rate capability of 0.5 MHz. In this work, analysis of human teeth treated by dental amalgam was performed by using the EDXRF imaging system mentioned above. The goal of the analysis is to evaluate the system capabilities in the biomedical field by measuring the drift of the major constituents of a dental amalgam, Zn and Hg, throughout the tooth structures. The elemental distribution pattern of these elements obtained during the analysis suggests diffusion of these elements from the amalgam to teeth tissues. - Highlights: • Demonstration of an EDXRF imaging system based on a 2D-MHSP detector for biological analysis • Evaluation of the drift of the dental amalgam constituents, throughout the teeth • Observation of Hg diffusion, due to hydroxyapatite crystal defects that compose the teeth tissues.

  9. X-ray diffraction from thin films : Size/strain analysis and whole pattern fitting

    Energy Technology Data Exchange (ETDEWEB)

    Scardi, P. [Trento Univ. (Italy). Dept. of Materials Engineering

    1996-09-01

    Line Profile Analysis (LPA) and whole pattern fitting may be used with success for the characterization of thin films from XRD data collected with the traditional Bragg-Brentano geometry. The size/strain analysis was conducted by an integrated procedure of profile modelling-assisted Fourier analysis, in order to measure the content of lattice imperfections and crystalline domain size along the growth direction in heteroepitaxial thin films. The microstructure of these films is typical of several PVD processes for the production of highly textured and low-defect thin crystalline layers. The same analysis could be conducted on random thin films as well, and in this case it is possible to determine an average crystallite size and shape. As will be shown in the paper, structural and microstructural parameters obtained by these methods may be correlated with thin film properties of technological interest. The whole pattern analysis may be used to obtain the information contained in a wide region of the diffraction pattern. This approach, currently used for the quantitative analysis of phase mixtures in traditional powder samples, was modified to account both for the size/strain effects, according to a simplified LPA, and for the structure of thin films and multi-layer systems. In this way, a detailed analysis based on a structural model for the present phases can be performed considering the real geometry of these samples. In particular, the quantitative phase analysis could be conducted in terms of layer thickness instead of volume or weight fractions.

  10. Comparison of the magnetic properties of GeMn thin films through Mn L-edge x-ray absorption

    Energy Technology Data Exchange (ETDEWEB)

    Ahlers, S.; Stone, P.R.; Sircar, N.; Arenholz, E.; Dubon, O. D.; Bougeard, D.

    2009-08-04

    X-ray absorption spectroscopy of epitaxial GeMn thin films reveals an experimentally indistinguishable electronic configuration of Mn atoms incorporated in Ge{sub 1?x}Mn{sub x} nanoclusters and in precipitates of the intermetallic compound Mn{sub 5}Ge{sub 3}, respectively. However, the average magnetic response of thin films containing Ge{sub 1?x}Mn{sub x} nanoclusters is lower than the response of films containing Mn{sub 5}Ge{sub 3} precipitates. This reduced magnetic response of Ge{sub 1?x}Mn{sub x} nanoclusters is explained in terms of a fraction of Mn atoms being magnetically inactive due to antiferromagnetic coupling or the presence of structural disorder. A determination of the role of magnetically inactive Mn atoms in the self-assembly of the thermodynamically metastable Ge{sub 1?x}Mn{sub x} nanoclusters seems to be an essential ingredient for an enhanced control of this promising high Curie temperature magnetic semiconductor.

  11. Magnetic x-ray linear dichroism of ultrathin Fe-Ni alloy films

    Energy Technology Data Exchange (ETDEWEB)

    Schumann, F.O.; Willis, R.F. [Pennsylvania State Univ., University Park, PA (United States); Goodman, K.W. [Lawrence Berkeley National Lab., CA (United States)] [and others

    1997-04-01

    The authors have studied the magnetic structure of ultrathin Fe-Ni alloy films as a function of Fe concentration by measuring the linear dichroism of the 3p-core levels in angle-resolved photoemission spectroscopy. The alloy films, grown by molecular-beam epitaxy on Cu(001) surfaces, were fcc and approximately four monolayers thick. The intensity of the Fe dichroism varied with Fe concentration, with larger dichroisms at lower Fe concentrations. The implication of these results to an ultrathin film analogue of the bulk Invar effect in Fe-Ni alloys will be discussed. These measurements were performed at the Spectromicroscopy Facility (Beamline 7.0.1) of the Advanced Light Source.

  12. Dose-response curve of EBT, EBT2, and EBT3 radiochromic films to synchrotron-produced monochromatic x-ray beams

    Energy Technology Data Exchange (ETDEWEB)

    Brown, Thomas A. D.; Hogstrom, Kenneth R.; Alvarez, Diane; Matthews, Kenneth L. II; Ham, Kyungmin; Dugas, Joseph P. [Mary Bird Perkins Cancer Center, 4950 Essen Lane, Baton Rouge, Louisiana 70809 and Department of Physics and Astronomy, Louisiana State University and A and M College, 202 Nicholson Hall, Baton Rouge, Louisiana 70803 (United States); Department of Physics and Astronomy, Louisiana State University and A and M College, 202 Nicholson Hall, Baton Rouge, Louisiana 70803 (United States); Center for Advanced Microstructures and Devices, Louisiana State University and A and M College, 6980 Jefferson Highway, Baton Rouge, Louisiana 70806 (United States); Mary Bird Perkins Cancer Center, 4950 Essen Lane, Baton Rouge, Louisiana 70809 and Department of Physics and Astronomy, Louisiana State University and A and M College, 202 Nicholson Hall, Baton Rouge, Louisiana 70803 (United States)

    2012-12-15

    Purpose: This work investigates the dose-response curves of GAFCHROMIC{sup Registered-Sign} EBT, EBT2, and EBT3 radiochromic films using synchrotron-produced monochromatic x-ray beams. EBT2 film is being utilized for dose verification in photoactivated Auger electron therapy at the Louisiana State University Center for Advanced Microstructures and Devices (CAMD) synchrotron facility. Methods: Monochromatic beams of 25, 30, and 35 keV were generated on the tomography beamline at CAMD. Ion chamber depth-dose measurements were used to determine the dose delivered to films irradiated at depths from 0.7 to 8.5 cm in a 10 Multiplication-Sign 10 Multiplication-Sign 10-cm{sup 3} polymethylmethacrylate phantom. AAPM TG-61 protocol was applied to convert measured ionization into dose. Films were digitized using an Epson 1680 Professional flatbed scanner and analyzed using the net optical density (NOD) derived from the red channel. A dose-response curve was obtained at 35 keV for EBT film, and at 25, 30, and 35 keV for EBT2 and EBT3 films. Calibrations of films for 4 MV x-rays were obtained for comparison using a radiotherapy accelerator at Mary Bird Perkins Cancer Center. Results: The sensitivity (NOD per unit dose) of EBT film at 35 keV relative to that for 4-MV x-rays was 0.73 and 0.76 for doses 50 and 100 cGy, respectively. The sensitivity of EBT2 film at 25, 30, and 35 keV relative to that for 4-MV x-rays varied from 1.09-1.07, 1.23-1.17, and 1.27-1.19 for doses 50-200 cGy, respectively. For EBT3 film the relative sensitivity was within 3% of unity for all three monochromatic x-ray beams. Conclusions: EBT and EBT2 film sensitivity showed strong energy dependence over an energy range of 25 keV-4 MV, although this dependence becomes weaker for larger doses. EBT3 film shows weak energy dependence, indicating that it would be a better dosimeter for kV x-ray beams where beam hardening effects can result in large changes in the effective energy.

  13. Information detective quantum efficiency of X-ray film-intensifier foil systems

    Energy Technology Data Exchange (ETDEWEB)

    Hoeschen, D.; Stargardt, A.; Mirande, W.

    1988-04-01

    The capability of screen-film combinations of detection and representation of information is described by the detective quantum efficiency (DQE). The DQE may be calculated from the sensitivity, the gradient of the characteristic curve, the modulation transfer function and the Wiener spectrum. These parameters have been determined for fourteen screen-film combinations and the DQE's have been calculated. It is shown that the low frequency region the DQE does not depend on spatial frequency. This constant level of DQE is mostly dependent on the absorbance of the screens. Consequences from this fact, as well for the manufacturer as for the user of the screens, are discussed.

  14. SU-E-CAMPUS-I-01: Nanometric Organic Photovoltaic Thin Film X-Ray Detectors for Clinical KVp Beams

    Energy Technology Data Exchange (ETDEWEB)

    Elshahat, Bassem; Gill, Hardeep; Kumar, Jayant; Sajo, Erno [University of Massachusetts Lowell, Department of Physics and Applied Physics, Lowell, MA (United States); Filipyev, Ilya; Zygmanski, Piotr [Brigham and Women' s Hospital, Boston, MA (United States); Shrestha, Suman [Brigham and Women' s Hospital, Boston, MA (United States); University of Massachusetts Medical School, Worcester, MA (United States); Hesser, Jurgen [Department of Radiation Oncology, University Medical Center Mannheim (Germany); Karellas, Andrew [University of Massachusetts Medical School, Worcester, MA (United States)

    2014-06-15

    Purpose: To fabricate and test nanometric organic photovoltaic (OPV) cells made of various active-layer/electrode thicknesses and sizes; to determine the optimal material combinations and geometries suitable for dose measurements in clinical kilovoltage x-ray beams. Methods: The OPV consisted of P3HT:PCBM photoactive materials sandwiched between aluminum and Indium Tin Oxide (ITO) electrodes. Direct conversion of xrays in the active layer composed of donor and acceptor semiconducting organic materials generated signal in photovoltaic mode (without external voltage bias). OPV cells were fabricated with different active layer thicknesses (150, 270, 370 nm) and electrode areas (0.4, 0.7, 0.9, 1.4, 2.6 cm{sup 2}). A series of experiments were preformed in the energy range of 60–150 kVp. The net current per unit area (nA/cm{sup 2}) was measured using 200 mAs time-integrated beam current. Results: The net OPV current as function of beam energy (kVp) was proportional to ∼E{sup 0,4} {sup 5} when adjusted for beam output. The best combination of parameters for these cells was 270 nm active layer thicknesses for 0.7 cm{sup 2} electrode area. The measured current ranged from 0.69 to 2.43 nA/cm{sup 2} as a function of x-ray energy between 60 and 150 kVp, corresponding to 0.09 – 0.06 nA/cm{sup 2}/mGy, respectively, when adjusted for the beam output. Conclusion: The experiments indicate that OPV detectors possessing 270 nm active layer and 0.7 cm{sup 2} Al electrode areas have sensitivity by a factor of 2.5 greater than commercial aSi thin film PV. Because OPV can be made flexible and they do not require highvoltage bias supply, they open the possibility for using as in-vivo detectors in radiation safety in x-ray imaging beams.

  15. Boron carbide coatings for neutron detection probed by x-rays, ions, and neutrons to determine thin film quality

    Energy Technology Data Exchange (ETDEWEB)

    Nowak, G., E-mail: Gregor.Nowak@hzg.de; Störmer, M.; Horstmann, C.; Kampmann, R.; Höche, D.; Lorenz, U.; Müller, M.; Schreyer, A. [Helmholtz-Zentrum Geesthacht, Max-Planck-Straße 1, 21502 Geesthacht (Germany); Becker, H.-W. [RUBION-Zentrale Einrichtung für Ionenstrahlen und Radionuklide, Ruhr-Universität Bochum, 44780 Bochum (Germany); Haese-Seiller, M.; Moulin, J.-F.; Pomm, M. [Helmholtz-Zentrum Geesthacht, Außenstelle an der Forschungsneutronenquelle Heinz Maier-Leibnitz (FRM II), Technische Universität München, 85747 Garching (Germany); Randau, C. [Georg-August Universität Göttingen, Geowissenschaftliches Zentrum, 37077 Göttingen, Germany and Außenstelle an der Forschungsneutronenquelle Heinz Maier-Leibnitz (FRM II), Technische Universität München, 85747 Garching (Germany); Hall-Wilton, R. [European Spallation Source ESS AB, P.O. Box 176, 221 00 Lund (Sweden)

    2015-01-21

    Due to the present shortage of {sup 3}He and the associated tremendous increase of its price, the supply of large neutron detection systems with {sup 3}He becomes unaffordable. Alternative neutron detection concepts, therefore, have been invented based on solid {sup 10}B converters. These concepts require development in thin film deposition technique regarding high adhesion, thickness uniformity and chemical purity of the converter coating on large area substrates. We report on the sputter deposition of highly uniform large-area {sup 10}B{sub 4}C coatings of up to 2 μm thickness with a thickness deviation below 4% using the Helmholtz-Zentrum Geesthacht large area sputtering system. The {sup 10}B{sub 4}C coatings are x-ray amorphous and highly adhesive to the substrate. Material analysis by means of X-ray-Photoelectron Spectroscopy, Secondary-Ion-Mass-Spectrometry, and Rutherford-Back-Scattering (RBS) revealed low impurities concentration in the coatings. The isotope composition determined by Secondary-Ion-Mass-Spectrometry, RBS, and inelastic nuclear reaction analysis of the converter coatings evidences almost identical {sup 10}B isotope contents in the sputter target and in the deposited coating. Neutron conversion and detection test measurements with variable irradiation geometry of the converter coating demonstrate an average relative quantum efficiency ranging from 65% to 90% for cold neutrons as compared to a black {sup 3}He-monitor. Thus, these converter coatings contribute to the development of {sup 3}He-free prototype detectors based on neutron grazing incidence. Transferring the developed coating process to an industrial scale sputtering system can make alternative {sup 3}He-free converter elements available for large area neutron detection systems.

  16. Boron carbide coatings for neutron detection probed by x-rays, ions, and neutrons to determine thin film quality

    Science.gov (United States)

    Nowak, G.; Störmer, M.; Becker, H.-W.; Horstmann, C.; Kampmann, R.; Höche, D.; Haese-Seiller, M.; Moulin, J.-F.; Pomm, M.; Randau, C.; Lorenz, U.; Hall-Wilton, R.; Müller, M.; Schreyer, A.

    2015-01-01

    Due to the present shortage of 3He and the associated tremendous increase of its price, the supply of large neutron detection systems with 3He becomes unaffordable. Alternative neutron detection concepts, therefore, have been invented based on solid 10B converters. These concepts require development in thin film deposition technique regarding high adhesion, thickness uniformity and chemical purity of the converter coating on large area substrates. We report on the sputter deposition of highly uniform large-area 10B4C coatings of up to 2 μm thickness with a thickness deviation below 4% using the Helmholtz-Zentrum Geesthacht large area sputtering system. The 10B4C coatings are x-ray amorphous and highly adhesive to the substrate. Material analysis by means of X-ray-Photoelectron Spectroscopy, Secondary-Ion-Mass-Spectrometry, and Rutherford-Back-Scattering (RBS) revealed low impurities concentration in the coatings. The isotope composition determined by Secondary-Ion-Mass-Spectrometry, RBS, and inelastic nuclear reaction analysis of the converter coatings evidences almost identical 10B isotope contents in the sputter target and in the deposited coating. Neutron conversion and detection test measurements with variable irradiation geometry of the converter coating demonstrate an average relative quantum efficiency ranging from 65% to 90% for cold neutrons as compared to a black 3He-monitor. Thus, these converter coatings contribute to the development of 3He-free prototype detectors based on neutron grazing incidence. Transferring the developed coating process to an industrial scale sputtering system can make alternative 3He-free converter elements available for large area neutron detection systems.

  17. Development of a concept for radiation patients exposure assessment during dental X-ray examinations and statistical data acquisition for the determination of a diagnostic reference value; Erarbeitung eines Konzepts zur Ermittlung der Strahlenexposition von Patienten bei zahnmedizinischen Roentgenuntersuchungen und Erhebung von statistischen Daten zur Erstellung diagnostischer Referenzwerten

    Energy Technology Data Exchange (ETDEWEB)

    Kueppers, C.; Sering, M. [Oekoinstitut Freiburg e.V., Freiburg (Germany); Poppe, B.; Poplawski, A.; Looe, H.K.; Beyer, D.; Pfaffenberger, A.; Chofor, N.; Eenboom, F. [Pius Hospital, Oldenburg (Germany)

    2012-02-15

    The research project on the development a concept for radiation patients exposure assessment during dental X-ray examinations and statistical data acquisition for the determination of a diagnostic reference value includes the following issues: Fundamental facts: dental X-ray examination techniques, dose relevant factors and characteristics during X-ray examinations, radiation exposed organs during dental X-ray examinations, dose assessment based on phantoms. Materials and methodologies of the project: TLD measurements using the phantom, calculation of the effective dose during dental X-ray examinations, properties and settings of the reference facilities for the determination of radiation exposure, selection of dental offices, dosimetric measurements, data acquisition and statistical evaluation. Results of dosimetric examinations: results of dosimetric measurements at reference facilities, results of dosimetric measurements in dental offices. Discussion of the concept for the determination of the radiation exposure during dental X-ray examinations.

  18. Fullerene films and fullerene-dodecylamine adduct monolayers at air-water interfaces studied by neutron and x-ray reflection

    DEFF Research Database (Denmark)

    Wang, J.Y.; Vaknin, D.; Uphaus, R.A.;

    1994-01-01

    Neutron and X-ray reflection measurements and surface pressure isotherms of spread films of the fullerene-dodecylamine adduct C60-[NH2(CH2)11CH3]x all indicate that this material may form monomolecular layers on water surfaces. The reflection data sets (neutron on both H2O and D2O) can be accounted...

  19. Metal-to-ligand and ligand-to-metal charge transfer in thin films of Prussian blue analogues investigated by X-ray absorption spectroscopy

    NARCIS (Netherlands)

    Bonhommeau, Sebastien; Pontius, Niko; Cobo, Saioa; Salmon, Lionel; de Groot, Frank M. F.; Molnar, Gabor; Bousseksou, Azzedine; Duerr, Hermann A.; Eberhardt, Wolfgang

    2008-01-01

    A series of thin films of Prussian blue analogues is investigated by X-ray absorption spectroscopy (XAS) at the Fe, Co and Mn L(2,3)-edges. The ligand field multiplet theory enables us to examine accurately the electronic structure of these materials. Experimental XAS spectra of CoFe Prussian blue a

  20. In situ monitoring of laser-induced periodic surface structures formation on polymer films by grazing incidence small-angle X-ray scattering

    NARCIS (Netherlands)

    Rebollar, Esther; Rueda, Daniel R; Martín-Fabiani, Ignacio; Rodríguez-Rodríguez, Álvaro; García-Gutiérrez, Mari-Cruz; Portale, Giuseppe; Castillejo, Marta; Ezquerra, Tiberio A

    2015-01-01

    The formation of laser-induced periodic surface structures (LIPSS) on model spin-coated polymer films has been followed in situ by grazing incidence small-angle X-ray scattering (GISAXS) using synchrotron radiation. The samples were irradiated at different repetition rates ranging from 1 up to 10 Hz

  1. Applicability of X-ray fluorescence spectroscopy as method to determine thickness and composition of stacks of metal thin films: A comparison with imaging and profilometry

    NARCIS (Netherlands)

    Vrielink, J.A.M.; Tiggelaar, R.M.; Gardeniers, J.G.E.; Lefferts, L.

    2012-01-01

    In this work the applicability of X-ray fluorescence spectroscopy (XRF) for fast, accurate and non-destructive determination of the thickness of a variety of single-layer and multi-layer metal thin films deposited on glass and silicon is investigated. Data obtained with XRF is compared with informat

  2. Agreement and reading time for differently-priced devices for the digital capture of X-ray films.

    Science.gov (United States)

    Salazar, Antonio José; Camacho, Juan Camilo; Aguirre, Diego Andrés

    2012-03-01

    We assessed the reliability of three digital capture devices: a film digitizer (which cost US $15,000), a flat-bed scanner (US $1800) and a digital camera (US $450). Reliability was measured as the agreement between six observers when reading images acquired from a single device and also in terms of the pair-device agreement. The images were 136 chest X-ray cases. The variables measured were the interstitial opacities distribution, interstitial patterns, nodule size and percentage pneumothorax size. The agreement between the six readers when reading images acquired from a single device was similar for the three devices. The pair-device agreements were moderate for all variables. There were significant differences in reading-time between devices: the mean reading-time for the film digitizer was 93 s, it was 59 s for the flat-bed scanner and 70 s for the digital camera. Despite the differences in their cost, there were no substantial differences in the performance of the three devices.

  3. X-ray magnetic circular dichroism study of epitaxial magnetite ultrathin film on MgO(100)

    Energy Technology Data Exchange (ETDEWEB)

    Liu, W. Q.; Xu, Y. B., E-mail: yongbing.xu@york.ac.uk, E-mail: rzhang@nju.edu.cn [York-Nanjing International Center for Spintronics (YNICS), School of Electronics Science and Engineering, Nanjing University, Nanjing 210093 (China); Spintronics and Nanodevice Laboratory, Department of Electronics, University of York, York YO10 5DD (United Kingdom); Song, M. Y.; Lin, J. G. [Center for Condensed Matter Sciences, National Taiwan University, Taipei 106, Taiwan (China); Maltby, N. J.; Li, S. P. [Spintronics and Nanodevice Laboratory, Department of Electronics, University of York, York YO10 5DD (United Kingdom); Samant, M. G.; Parkin, S. S. P. [IBM Research Division, Almaden Research Center, San Jose, California 95120 (United States); Bencok, P.; Steadman, Paul; Dobrynin, Alexey [Diamond Light Source, Didcot OX11 0DE (United Kingdom); Zhang, R., E-mail: yongbing.xu@york.ac.uk, E-mail: rzhang@nju.edu.cn [York-Nanjing International Center for Spintronics (YNICS), School of Electronics Science and Engineering, Nanjing University, Nanjing 210093 (China)

    2015-05-07

    The spin and orbital magnetic moments of the Fe{sub 3}O{sub 4} epitaxial ultrathin film synthesized by plasma assisted simultaneous oxidization on MgO(100) have been studied with X-ray magnetic circular dichroism. The ultrathin film retains a rather large total magnetic moment, i.e., (2.73 ± 0.15) μ{sub B}/f.u., which is ∼70% of that for the bulk-like Fe{sub 3}O{sub 4}. A significant unquenched orbital moment up to 0.54 ± 0.05 μ{sub B}/f.u. was observed, which could come from the symmetry breaking at the Fe{sub 3}O{sub 4}/MgO interface. Such sizable orbital moment will add capacities to the Fe{sub 3}O{sub 4}-based spintronics devices in the magnetization reversal by the electric field.

  4. X-ray diffraction from thin films : Residual stress and texture analysis

    Energy Technology Data Exchange (ETDEWEB)

    Leoni, M.; Scardi [Trento Univ. (Italy). Dept. of Materials Engineering

    1996-09-01

    In this short contribution the attention will be drawn to the use of XRD-based non-destructive techniques for the study of the stress state and the orientation (texture) of various technologically valuable films. The cases in which the texture is important will be presented and they are: applicative examples, spacing in a wide variety of application areas and regarding growth-induced and machining-induced orientation.

  5. ACCURATE QUANTIFICATION OF DRIED RESIDUE THIN FILMS USING X-RAY FLUORESCENCE

    Energy Technology Data Exchange (ETDEWEB)

    C. WORLEY; G. HAVRILLA

    2000-09-01

    An XRF specimen preparation method was developed to quantify the concentration of gallium in plutonium metal while minimizing the risk of contaminating the instrument with radioactive material. To ensure that homogeneous specimens are examined, plutonium is dissolved in dilute HCl and HNO{sub 3} prior to analysis. In the preliminary work here, non-radioactive aqueous gallium standards were prepared, and zinc was added as an internal standard to improve the accuracy and precision. Aliquots from these solutions were cast on Mylar XRF films and air dried prior to analysis. Two methods of casting the solutions were evaluated: (1) casting as a thin layer using a surfactant to wet the support film and (2) casting multiple small spots on the support film. Aqueous gallium standards were prepared and cast as dried residue specimens using each method. These specimens were then analyzed, and calibration curves were prepared. Highly linear calibrations were obtained for each preparation method when zinc was used as the internal standard (RMS values {le}1% of the standards concentration range in both cases). Based on this preliminary work, this dried residue process appears very promising for the accurate quantification of gallium in plutonium.

  6. Ti K-edge X-ray absorption spectra of spray pyrolysis synthesized TiO2-x and TiO2-x Nx thin films

    Science.gov (United States)

    Sahoo, Madhusmita; Yadav, Ashok Kumar; Jha, S. N.; Bhattacharyya, Dibyendu; Mathews, Tom; Dash, S.

    2017-05-01

    Oxygen deficient TiO2 and N-TiO2 anatase thin films were synthesized by employing a two step process. First TiO2 and N-TiO2 films were synthesized by using a cost effective spray pyrolysis method. Subsequently, these films were reduced under H2 to create oxygen vacancies. Formation of oxygen vacancies was confirmed by using synchrotron source X-ray Absorption Spectroscopy (XAS). Effect of oxygen vacancies on electronic and structural properties were deduced from the near edge and extended region analysis of the X-ray absorption spectra. It is inferred that reduction time plays a crucial role in creating oxygen vacancies and number of oxygen vacancies increases with increase in reduction time. Substrate effect was delineated by using Si and FTO (Fluorine doped tin oxide coated glass) as substrates for film deposition.

  7. Performance of a gaseous detector based energy dispersive X-ray fluorescence imaging system: Analysis of human teeth treated with dental amalgam

    Science.gov (United States)

    Silva, A. L. M.; Figueroa, R.; Jaramillo, A.; Carvalho, M. L.; Veloso, J. F. C. A.

    2013-08-01

    Energy dispersive X-ray fluorescence (EDXRF) imaging systems are of great interest in many applications of different areas, once they allow us to get images of the spatial elemental distribution in the samples. The detector system used in this study is based on a micro patterned gas detector, named Micro-Hole and Strip Plate. The full field of view system, with an active area of 28 × 28 mm2 presents some important features for EDXRF imaging applications, such as a position resolution below 125 μm, an intrinsic energy resolution of about 14% full width at half maximum for 5.9 keV X-rays, and a counting rate capability of 0.5 MHz. In this work, analysis of human teeth treated by dental amalgam was performed by using the EDXRF imaging system mentioned above. The goal of the analysis is to evaluate the system capabilities in the biomedical field by measuring the drift of the major constituents of a dental amalgam, Zn and Hg, throughout the tooth structures. The elemental distribution pattern of these elements obtained during the analysis suggests diffusion of these elements from the amalgam to teeth tissues.

  8. X-ray analysis of spintronic semiconductor and half metal thin film systems; Roentgenstrukturuntersuchungen an spintronischen Halbleiter- und Halbmetall-Duennschichtsystemen

    Energy Technology Data Exchange (ETDEWEB)

    Stahl, Andreas

    2010-07-01

    In this work the structural properties of spintronic semiconductor and halfmetalic thin-film systems were investigated. The layer thicknesses and interface roughnesses of the multi-layer systems were estimated by X-ray reflectivity measurements. The fits were performed using the software Fewlay which uses the Parratt formalism to calculate the reflectivities. The relaxation of the films was analyzed by reciprocal space mapping on preferably highly indexed Bragg reflexes. (orig.)

  9. Strain in epitaxial MnSi films on Si(111) in the thick film limit studied by polarization-dependent extended x-ray absorption fine structure

    Science.gov (United States)

    Figueroa, A. I.; Zhang, S. L.; Baker, A. A.; Chalasani, R.; Kohn, A.; Speller, S. C.; Gianolio, D.; Pfleiderer, C.; van der Laan, G.; Hesjedal, T.

    2016-11-01

    We report a study of the strain state of epitaxial MnSi films on Si(111) substrates in the thick film limit (100-500 Å) as a function of film thickness using polarization-dependent extended x-ray absorption fine structure (EXAFS). All films investigated are phase-pure and of high quality with a sharp interface between MnSi and Si. The investigated MnSi films are in a thickness regime where the magnetic transition temperature Tc assumes a thickness-independent enhanced value of ≥43 K as compared with that of bulk MnSi, where Tc≈29 K . A detailed refinement of the EXAFS data reveals that the Mn positions are unchanged, whereas the Si positions vary along the out-of-plane [111] direction, alternating in orientation from unit cell to unit cell. Thus, for thick MnSi films, the unit cell volume is essentially that of bulk MnSi—except in the vicinity of the interface with the Si substrate (thin film limit). In view of the enhanced magnetic transition temperature we conclude that the mere presence of the interface, and its specific characteristics, strongly affects the magnetic properties of the entire MnSi film, even far from the interface. Our analysis provides invaluable information about the local strain at the MnSi/Si(111) interface. The presented methodology of polarization dependent EXAFS can also be employed to investigate the local structure of other interesting interfaces.

  10. X-ray-absorption fine-structure studies of superconducting Tl2CaBa2Cu2Ox thin films

    Science.gov (United States)

    Dimarzio, D.; Wiesmann, H.; Chen, D. H.; Heald, S. M.

    1990-07-01

    Superconducting Tl-Ca-Ba-Cu-O thin films have been prepared by the technique of reactive magnetron sputtering using targets of Tl, Ca-Ba, and Cu. Three films with different quality superconducting transitions were fabricated and analyzed. X-ray-absorption fine-structure measurements were performed on the Cu K edge in order to determine orientation, bond lengths, number of nearest neighbors, and relative disorder as a function of the quality of their superconducting transition. Magnetically oriented powder samples of the appropriate superconducting phase were used for comparison. X-ray-absorption near-edge results reveal increasing CuO2 plane orientation parallel to the substrate as the quality of the superconducting transition improved, consistent with x-ray-diffraction data. Extended x-ray-absorption fine-structure (EXAFS) measurements also show this trend. EXAFS gives a Cu-O(1) bond length of 1.92+/-0.01 Å for all three films, and all three samples exhibit an increasing Debye-Waller disorder factor consistent with the deterioration in the quality of their superconducting transitions.

  11. In situ studies of complex PLD-grown films using hard X-ray surface diffraction

    Science.gov (United States)

    Willmott, P. R.; Schlepütz, C. M.; Patterson, B. D.; Herger, R.; Lange, M.; Meister, D.; Maden, D.; Brönnimann, Ch.; Eikenberry, E. F.; Hülsen, G.; Al-Adwan, A.

    2005-07-01

    A novel ultra-high vacuum chamber for growing films via pulsed laser deposition and studying the growth processes in situ using hard synchrotron radiation is presented. The chamber is mounted onto a 5-circle surface diffractometer and contains a large cylindrical-section beryllium window, which allows an extensive range of reciprocal space to be probed. The chamber is primarily used to perform surface diffraction measurements, for which much of the most valuable information derives from the weakest signals. With this in mind, we have employed a photon-counting area pixel detector system, which reduces data acquisition times by one to two orders of magnitude and concomitantly increases the potential volume of data that can be acquired for any given sample before the surface degrades due to surface contamination or radiation damage. Examples are presented of initial results obtained using this system.

  12. X-Ray Detection Visits the Classroom

    Science.gov (United States)

    Peralta, Luis; Farinha, Ana; Pinto, Ana

    2008-01-01

    Film has been used to detect x-rays since the early days of their discovery by Rontgen. Although nowadays superseded by other techniques, film still provides a cheap means of x-ray detection, making it attractive in high-school or undergraduate university courses. If some sort of quantitative result is required, the film's optical absorbance or…

  13. Evolution of Surface Morphology and Chemistry in ZnO Thin Films and Steel Surfaces studied by Synchrotron X-ray Spectroscopy and Imaging

    Science.gov (United States)

    Jiang, Hua

    Thin film and surface treatment play an important role in developing materials with unique properties. They have been widely used in energy generation and storage, optical devices, LEDS, electrical semiconductor devices, etc. The stability and functionality of them under operational environment are important, especially the surface morphology and chemical evolution at micro-scale. This information is critical to understand the behaviors of the materials under various environments for a wide range of applications. Synchrotron x-ray fluorescence (XRF) and x-ray absorption near edge structure (XANES) are suitable techniques on investigating surface morphology and chemical evolution. Here, we use both techniques to investigate chemical and morphological heterogeneity of zinc oxide thin films after environmental humidity exposure, as well as surface and chemical evolution of iron oxidation states during iron redox process for samples with/without surface anti-corrosion treatment. Zinc oxide (ZnO) thin films have been reported to suffer from degradation in electrical properties, leading to failure of electronics due to environmental factors, such as heat and humidity. While degradation appears to be linked to water and oxygen penetration in the ZnO film, a direct observation in ZnO film morphological evolution, in conjunction with structural and chemical changes is lacking. Here, we systematically investigated the chemical and morphological heterogeneity of ZnO thin films caused by steam treatment. X-ray fluorescence microscopy, absorption spectroscopy, grazing incident small angle and wide angle scattering, scanning electron microscopy (SEM), ultra-high-resolution SEM and optical microscopy were carried out to examine ZnO, Al-doped ZnO and Ga-doped ZnO thin films, on two different substrates - silicon wafer and PET film. The environmental aging introduced pin-holes in the un-doped ZnO thin film. More significant morphological features formed in the Al-doped ZnO thin

  14. Chest X Ray?

    Science.gov (United States)

    ... this page from the NHLBI on Twitter. Chest X Ray A chest x ray is a fast and painless imaging test ... tissue scarring, called fibrosis. Doctors may use chest x rays to see how well certain treatments are ...

  15. X-Rays

    Science.gov (United States)

    X-rays are a type of radiation called electromagnetic waves. X-ray imaging creates pictures of the inside of ... different amounts of radiation. Calcium in bones absorbs x-rays the most, so bones look white. Fat ...

  16. Medical X-Rays

    Science.gov (United States)

    ... Benefits The discovery of X-rays and the invention of CT represented major advances in medicine. X- ... in X-ray and CT Examinations — X-ray definition, dose measurement, safety precautions, risk, and consideration with ...

  17. X-ray photoelectron spectroscopy analysis for undegraded and degraded Gd2O2S:Tb3+ phosphor thin films

    Science.gov (United States)

    Dolo, J. J.; Swart, H. C.; Terblans, J. J.; Coetsee, E.; Ntwaeaborwa, O. M.; Dejene, B. F.

    2012-05-01

    This paper presents the X-ray Photoelectron Spectroscopy (XPS) analysis for the undegraded and degraded Gd2O2S:Tb3+ thin film phosphor. The thin films were grown with the pulsed laser deposition (PLD) technique. XPS measurements were done on Gd2O2S:Tb3+ phosphor thin films before and after electron degradation. The XPS technique has proven the presence of Gd2O3 on the degraded and undegraded thin film spots. The presence of the SO2 bonding was also detected after degradation. This clearly indicates that surface reactions did occur during prolonged electron bombardment in an oxygen atmosphere.

  18. X-ray fluorescence holography

    CERN Document Server

    Hayashi, K; Takahashi, Y

    2003-01-01

    X-ray fluorescence holography (XFH) is a new structural analysis method of determining a 3D atomic arrangement around fluorescing atoms. We developed an XFH apparatus using advanced X-ray techniques and succeeded in obtaining high-quality hologram data. Furthermore, we introduced applications to the structural analysis of a thin film and the environment around dopants and, discussed the quantitative analysis of local lattice distortion. (author)

  19. Resonant soft X-ray reflectivity of ultrathin polymer films at the C-edge: A direct approach

    Directory of Open Access Journals (Sweden)

    Alain Gibaud

    2016-09-01

    Full Text Available The use of resonant soft X-ray reflectivity (RSXRR in s-polarization is presented with the aim to show how far it is possible to go in the understanding the evolution of the refractive index n(E=1−δ(E−iβ(E of a ultrathin polystyrene film when the RSXRR is measured through the C-edge. We evidence that a direct fit to the data provides a very good estimation of δ(E and β(E in a large range of energies. Nevertheless, at some specific energy close to C-edge we observe that it is not possible to obtain a satisfactory fit to the data though the same formalism is applied to calculate the reflectivity. We show that even though we take into account the energy resolution of the incident beam, we still end up with a poor fit at these energies. Incorporating the strong contribution of 2nd order photons appeared near C-edge we could not eliminate the discrepancy. Probably the data normalisations have some impacts on such discrepancies at some specific energies.

  20. Resonant soft X-ray reflectivity of ultrathin polymer films at the C-edge: A direct approach

    Science.gov (United States)

    Gibaud, Alain; Bal, Jayanta Kumar; Gullikson, Eric M.; Wang, Cheng; Vignaud, Guillaume

    2016-09-01

    The use of resonant soft X-ray reflectivity (RSXRR) in s-polarization is presented with the aim to show how far it is possible to go in the understanding the evolution of the refractive index n (E ) =1 -δ (E ) -i β (E ) of a ultrathin polystyrene film when the RSXRR is measured through the C-edge. We evidence that a direct fit to the data provides a very good estimation of δ (E ) and β (E ) in a large range of energies. Nevertheless, at some specific energy close to C-edge we observe that it is not possible to obtain a satisfactory fit to the data though the same formalism is applied to calculate the reflectivity. We show that even though we take into account the energy resolution of the incident beam, we still end up with a poor fit at these energies. Incorporating the strong contribution of 2nd order photons appeared near C-edge we could not eliminate the discrepancy. Probably the data normalisations have some impacts on such discrepancies at some specific energies.

  1. Scanning transmission X-ray microscopy of nano structured thin film catalysts for proton-exchange-membrane fuel cells

    Science.gov (United States)

    Lee, Vincent; Berejnov, Viatcheslav; West, Marcia; Kundu, Sumit; Susac, Darija; Stumper, Jürgen; Atanasoski, Radoslav T.; Debe, Mark; Hitchcock, Adam P.

    2014-10-01

    Scanning transmission X-ray microscopy (STXM) has been applied to characterize nano structured thin film (NSTF) catalysts implemented as electrode materials in proton-exchange-membrane (PEM) fuel cells. STXM is used to study all chemical constituents at various stages in the fabrication process, from the perylene red (PR149) starting material, through the formation of the uncoated perylene whiskers, their coated form with Pt-based catalyst, and toward the NSTF anode fully integrated into the catalyst coated membrane (CCM). CCM samples were examined prior to operational testing and after several different accelerated testing protocols: start-up/shut-down (SU/SD), and reversal tests. It was found that, while the perylene support material is present in the pre-test samples, it was completely absent in the post-test samples. We attribute this loss of perylene material to the presence of cracks in the catalyst combined with intensive hydrogenation processes happening at the anode during operation. Despite the loss of the perylene support, the platinum shells forming the NSTF anode catalyst layer performed well during the tests.

  2. Detection of short range order in SiO{sub 2} thin-films by grazing-incidence wide and small-angle X-ray scattering

    Energy Technology Data Exchange (ETDEWEB)

    Nagata, Kohki, E-mail: nagata.koki@iri-tokyo.jp [Tokyo Metropolitan Industrial Technology Research Institute, 2-4-10 Aomi, Koto-ku, Tokyo 135-0064 (Japan); School of Science and Technology, Meiji University, 1-1-1 Higashimita, Tama-ku, Kawasaki, Kanagawa 214-8571 (Japan); Ogura, Atsushi [School of Science and Technology, Meiji University, 1-1-1 Higashimita, Tama-ku, Kawasaki, Kanagawa 214-8571 (Japan); Hirosawa, Ichiro [Japan Synchrotron Radiation Research Institute (JASRI), 1-1-1, Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198 (Japan); Suwa, Tomoyuki; Teramoto, Akinobu; Ohmi, Tadahiro [New Industry Creation Hatchery Center, Tohoku University, 6-6-10 Aramakiazaaoba, Aoba-ku, Sendai, Miyagi 980-8579 (Japan)

    2016-04-21

    The effects of the fabrication process conditions on the microstructure of silicon dioxide thin films of <10 nm thickness are presented. The microstructure was investigated using grazing-incidence wide and small-angle X-ray scattering methods with synchrotron radiation. The combination of a high brilliance light source and grazing incident configuration enabled the observation of very weak diffuse X-ray scattering from SiO{sub 2} thin films. The results revealed different microstructures, which were dependent on oxidizing species or temperature. The micro-level properties differed from bulk properties reported in the previous literature. It was indicated that these differences originate from inner stress. The detailed structure in an amorphous thin film was not revealed owing to detection difficulties.

  3. Growth and structure of water on SiO2 films on Si investigated byKelvin probe microscopy and in situ X-ray Spectroscopies

    Energy Technology Data Exchange (ETDEWEB)

    Verdaguer, A.; Weis, C.; Oncins, G.; Ketteler, G.; Bluhm, H.; Salmeron, M.

    2007-06-14

    The growth of water on thin SiO{sub 2} films on Si wafers at vapor pressures between 1.5 and 4 torr and temperatures between -10 and 21 C has been studied in situ using Kelvin Probe Microscopy and X-ray photoemission and absorption spectroscopies. From 0 to 75% relative humidity (RH) water adsorbs forming a uniform film 4-5 layers thick. The surface potential increases in that RH range by about 400 mV and remains constant upon further increase of the RH. Above 75% RH the water film grows rapidly, reaching 6-7 monolayers at around 90% RH and forming a macroscopic drop near 100%. The O K-edge near-edge X-ray absorption spectrum around 75% RH is similar to that of liquid water (imperfect H-bonding coordination) at temperatures above 0 C and ice-like below 0 C.

  4. X-ray scattering evidence for the structural nature of fatigue in epitaxial Pb(Zr, Ti)O{sub 3} films.

    Energy Technology Data Exchange (ETDEWEB)

    Thompson, C.; Munkholm, A.; Streiffer, S. K.; Stephenson, G. B.; Ghosh, K.; Eastman, J. A.; Auciello, O.; Bai, G.-R.; Lee, M. K.; Eom, C. B.; Northern Illinois Univ.; Univ. of Wisconsin at Madison

    2001-05-28

    We have probed the microscopic distribution of 180{sup o} domains as a function of switching history in 40 nm epitaxial films of Pb(Zr{sub 0.30}Ti{sub 0.70})O{sub 3} by analyzing interference effects in the x-ray scattering profiles. These as-grown films exhibit voltage offsets (imprint) in the polarization hysteresis loops, coupled with a strongly preferred polarization direction in the virgin state. Our x-ray results are consistent with models attributing the loss of switchable polarization to the inhibition of the formation of oppositely polarized domains in a unipolar matrix. Using such model epitaxial films, we demonstrate that different microscopic ensembles of domains resulting from, for example, fatigue, may be resolved by this technique.

  5. Structure and growth of dotriacontane films on SiO_2 and Ag(111) surfaces: synchrotron X-ray scattering and molecular dynamics simulations

    DEFF Research Database (Denmark)

    Mo, H.; Trogisch, S.; Taub, H.

    2004-01-01

    We report synchrotron X-ray scattering experiments and molecular dynamics simulations of the structure and growth mode of dotriacontane (n-C32H(66) or C32) films adsorbed on Ag(111) and SiO2-coated Si(100) substrates. On the SiO2 surface, the X-ray measurements confirm a structural model...... observed structures with molecular dynamics simulations of a multilayer film of the homologous C24 molecule. (C) 2004 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim....... of the solid film inferred from high-resolution ellipsometry measurements in which one or two layers of C32 adsorb with the long axis of the molecule oriented parallel to the interface followed by a monolayer in which the molecules have a perpendicular orientation. At higher C32 coverages, preferentially...

  6. Using submicron-resolution LiF crystal and film x-ray detectors for the near and far fields in-situ characterization of soft x-ray laser beams

    Science.gov (United States)

    Pikuz, Tatiana A.; Faenov, Anatoly Y.; Fukuda, Yuji; Kato, Yoshiaki; Kawachi, Tetsuya; Kando, Masaki

    2012-01-01

    Review of results, obtained by using recently proposed new imaging detector, based on formation of color centers in LiF crystal and LiF film, for in situ high performance measurements of near-field and far-field properties of soft X-ray lasers (SXRL) beams is presented. Experiments have been carried out with laser-driven transient-collision plasma SXRL and free electron SXRL beams. It was demonstrated that due to favorable combination of high spatial resolution, high dynamic range and wide field of view this technique allows measuring not only intensity distribution across the full beam and in local areas, but also permits to evaluate coherence and spectral distribution of radiation across the beam. Experimental diffraction patterns in the images of periodical structures are analyzed by comparison with the modeled ones in the last case. The estimated accuracy of measurements is between 10-20%.

  7. Residual stress mapping by micro X-ray diffraction: Application to the study of thin film buckling

    Science.gov (United States)

    Goudeau, P.; Villain, P.; Tamura, N.; Celestre, R. S.; Padmore, H.

    2002-07-01

    Thin films deposited by Physical Vapour Deposition techniques on substrates generally exhibit large residual stresses which may be responsible of spontaneous detachment of the film from its substrate and in the case of compressive stresses, thin film buckling. Although these effects are undesirable for future applications, one may take benefit of it for thin film mechanical properties investigation. Since the 80's, a lot of theoretical works have been done to develop mechanical models with the aim to get a better understanding of driven mechanisms giving rise to this phenomenon and thus to propose solutions to avoid such problems. Nevertheless, only a few experimental works have been done on this subject to support these theoretical results and nothing concerning local stress/strain measurement mainly because of the small dimension of the buckling (few tenth μm). This paper deals with the application of micro beam x-ray diffraction available on synchrotron radiation sources for stress/strain mapping analysis of gold thin film buckling. Les films minces déposés par des techniques de dépôt physique sous vide sur substrats présentent généralement des contraintes résiduelles très élevées qui peuvent être responsables du délaminage spontané du film et dans le cas de contraintes de compression, de l'apparition de cloques. Bien que ces décollements soient indésirables pour les applications technologiques futures, ils peuvent être mis à profit pour analyser les propriétés mécaniques locales dans ces systèmes. Depuis le début des années 80, un grand nombre d'études théoriques ont permis de développer des modèles dans le soucis de mieux comprendre ces phénomènes de flambage. Néanmoins, la validation de ces modèles repose sur une confrontation avec des études expérimentales qui demeurent jusqu'à présent très rares. Ainsi, les champs de déformations associés à ces structures de décollements n'ont pas été déterminés du fait

  8. Locally resolved investigation of wedged Cu(In,Ga)Se{sub 2} films prepared by physical vapor deposition using hard X-ray photoelectron and X-ray fluorescence spectroscopy

    Energy Technology Data Exchange (ETDEWEB)

    Calvet, Wolfram, E-mail: wolfram.calvet@helmholtz-berlin.de [Helmholtz-Zentrum Berlin, Hahn-Meitner-Platz 1, D-14109 Berlin (Germany); Ümsür, Bünyamin; Höpfner, Britta; Lauermann, Iver; Prietzel, Karsten; Kaufmann, Christan A.; Unold, Thomas [Helmholtz-Zentrum Berlin, Hahn-Meitner-Platz 1, D-14109 Berlin (Germany); Lux-Steiner, Martha C. [Helmholtz-Zentrum Berlin, Hahn-Meitner-Platz 1, D-14109 Berlin (Germany); Freie Universität Berlin, Department of Physics, Arnimallee 14, D-14195 Berlin (Germany)

    2015-05-01

    We have investigated a specially grown Cu(In,Ga)Se{sub 2} (CIGSe) absorber, which was deposited by co-evaporation of Cu, In, Ga, and Se using a modified three stage process. Prior to the growth, the molybdenum-coated glass substrate was covered by a bent shroud made from tantalum (Ta), leading to a wedged absorber structure with a width of about 2 mm where the film thickness varies from 0 to 2 μm. In this region of interest the thickness dependency of morphology, concentration ratios and electronic properties was studied with secondary electron microscopy (SEM), X-ray fluorescence (XRF) and hard X-ray photoelectron spectroscopy (HAXPES), probing the CIGSe sample along the thickness gradient. The evidence of the thickness gradient itself was proven with SEM measurements in cross section geometry. By using XRF it was found that with decreasing film thickness the Cu concentration decreases significantly. This finding was also verified by HAXPES measurements. Furthermore, an enrichment of Ga towards the Mo back contact was found using the same technique. Besides these results the formation of a molybdenum selenide (MoSe) phase was observed on the fully covered part of the Mo coated substrate indicating a high mobility of Se on Mo under the given temperature conditions of the modified three stage deposition process. - Highlights: • Growth of a CIGSe wedge • Application of HAXPES and XRF as local probing techniques • Good agreement with former studies • Wedged CIGSe structures can be used for further, locally resolved experiments.

  9. Feasibility study for application of the compressed-sensing framework to interior computed tomography (ICT) for low-dose, high-accurate dental x-ray imaging

    Science.gov (United States)

    Je, U. K.; Cho, H. M.; Cho, H. S.; Park, Y. O.; Park, C. K.; Lim, H. W.; Kim, K. S.; Kim, G. A.; Park, S. Y.; Woo, T. H.; Choi, S. I.

    2016-02-01

    In this paper, we propose a new/next-generation type of CT examinations, the so-called Interior Computed Tomography (ICT), which may presumably lead to dose reduction to the patient outside the target region-of-interest (ROI), in dental x-ray imaging. Here an x-ray beam from each projection position covers only a relatively small ROI containing a target of diagnosis from the examined structure, leading to imaging benefits such as decreasing scatters and system cost as well as reducing imaging dose. We considered the compressed-sensing (CS) framework, rather than common filtered-backprojection (FBP)-based algorithms, for more accurate ICT reconstruction. We implemented a CS-based ICT algorithm and performed a systematic simulation to investigate the imaging characteristics. Simulation conditions of two ROI ratios of 0.28 and 0.14 between the target and the whole phantom sizes and four projection numbers of 360, 180, 90, and 45 were tested. We successfully reconstructed ICT images of substantially high image quality by using the CS framework even with few-view projection data, still preserving sharp edges in the images.

  10. Nondestructive measurement of the residual stress TiN thin film coated on AISI 304 substrate by x-ray stress analyzer

    Science.gov (United States)

    Zhang, Y. K.; Feng, A. X.; Lu, J. Z.; Kong, D. J.; Tang, C. P.

    2006-01-01

    Titanium nitride films are deposited on AISI 304 steel with a hollow-cathode-discharge (HCD) ion-plating technique. The status of residual stresses in TiN thin film coated on AISI304 substrate by HCD is studied by x-ray diffraction stress analyzer. By analyzing morphology of the residual stress of TiN thin film at interface between TiN film and AISI 304 substrate, the adhering mechanism of TiN thin film is understood as follows: the mechanical interlocking had important contribution to the adhesion strength, the thermal stress is the major factor which resulting TiN thin film peeling off spontaneously. The results show that the value of thin film is -210MPa~-650Mpa, and the thermal stress is compressive, the intrinsic stress is tensile, origins of the residual stress are primarily discussed.

  11. Preliminary validation of handheld X-ray fluorescence spectrometry: distinguishing osseous and dental tissue from nonbone material of similar chemical composition.

    Science.gov (United States)

    Zimmerman, Heather A; Schultz, John J; Sigman, Michael E

    2015-03-01

    One of the tasks of a forensic anthropologist is to sort human bone fragments from other materials, which can be difficult when dealing with highly fragmented and taphonomically modified material. The purpose of this research is to develop a method using handheld X-ray fluorescence (HHXRF) spectrometry to distinguish human and nonhuman bone/teeth from nonbone materials of similar chemical composition using multivariate statistical analyses. The sample materials were derived primarily from previous studies: human bone and teeth, nonhuman bone, nonbiological materials, nonbone biological materials, and taphonomically modified materials. The testing included two phases, testing both the reliability of the instrument and the accuracy of the technique. The results indicate that osseous and dental tissue can be distinguished from nonbone material of similar chemical composition with a high degree of accuracy (94%). While it was not possible to discriminate rock apatite and synthetic hydroxyapatite from bone/teeth, this technique successfully discriminated ivory and octocoral.

  12. Al capping layers for nondestructive x-ray photoelectron spectroscopy analyses of transition-metal nitride thin films

    Energy Technology Data Exchange (ETDEWEB)

    Greczynski, Grzegorz, E-mail: grzgr@ifm.liu.se; Hultman, Lars [Thin Film Physics Division, Department of Physics (IFM), Linköping University, SE-581 83 Linköping (Sweden); Petrov, Ivan [Thin Film Physics Division, Department of Physics (IFM), Linköping University, SE-581 83 Linköping, Sweden and Materials Science Department and Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana, Illinois 61801 (United States); Greene, J. E. [Thin Film Physics Division, Department of Physics (IFM), Linköping University, SE-581 83 Linköping (Sweden); Materials Science Department and Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana, Illinois 61801(United States); Department of Physics, University of Illinois, Urbana, Illinois 61801 (United States)

    2015-09-15

    X-ray photoelectron spectroscopy (XPS) compositional analyses of materials that have been air exposed typically require ion etching in order to remove contaminated surface layers. However, the etching step can lead to changes in sample surface and near-surface compositions due to preferential elemental sputter ejection and forward recoil implantation; this is a particular problem for metal/gas compounds and alloys such as nitrides and oxides. Here, the authors use TiN as a model system and compare XPS analysis results from three sets of polycrystalline TiN/Si(001) films deposited by reactive magnetron sputtering in a separate vacuum chamber. The films are either (1) air-exposed for ≤10 min prior to insertion into the ultrahigh-vacuum (UHV) XPS system; (2) air-exposed and subject to ion etching, using different ion energies and beam incidence angles, in the XPS chamber prior to analysis; or (3) Al-capped in-situ in the deposition system prior to air-exposure and loading into the XPS instrument. The authors show that thin, 1.5–6.0 nm, Al capping layers provide effective barriers to oxidation and contamination of TiN surfaces, thus allowing nondestructive acquisition of high-resolution core-level spectra representative of clean samples, and, hence, correct bonding assignments. The Ti 2p and N 1s satellite features, which are sensitive to ion bombardment, exhibit high intensities comparable to those obtained from single-crystal TiN/MgO(001) films grown and analyzed in-situ in a UHV XPS system and there is no indication of Al/TiN interfacial reactions. XPS-determined N/Ti concentrations acquired from Al/TiN samples agree very well with Rutherford backscattering and elastic recoil analysis results while ion-etched air-exposed samples exhibit strong N loss due to preferential resputtering. The intensities and shapes of the Ti 2p and N 1s core level signals from Al/TiN/Si(001) samples do not change following long-term (up to 70 days) exposure to ambient conditions

  13. Nanometer-resolution depth-resolved measurement of florescence-yield soft x-ray absorption spectroscopy for FeCo thin film

    Science.gov (United States)

    Sakamaki, M.; Amemiya, K.

    2017-08-01

    We develop a fluorescence-yield depth-resolved soft x-ray absorption spectroscopy (XAS) technique, which is based on the principle that the probing depth is changed by the emission angle of the fluorescence soft x rays. Compared with the electron-yield depth-resolved XAS technique, which has been established in this decade, we can observe wider range in-depth XAS distribution up to several tens of nm. Applying this technique to a 30 ML (˜4.3 nm) FeCo thin film, we observe Fe L-edge XAS spectra at the probing depth of 0.3-6 nm and find that the film has 22 ML (˜3.1 nm) surface oxide layer while its inner layer shows metallic state. We thus successfully obtain nanometer-resolution depth-resolved XAS spectra and further expect that operando measurement under the electric and/or magnetic fields is possible.

  14. On the response of semitransparent nanoparticulated films of LuPO{sub 4}:Eu in poly-energetic X-ray imaging applications

    Energy Technology Data Exchange (ETDEWEB)

    Seferis, I.E.; Zeler, J.; Zych, E. [University of Wroclaw, Faculty of Chemistry, Wroclaw (Poland); Michail, C.; Valais, I.; Fountos, G.; Kalyvas, N.; Kandarakis, I. [Technological Educational Institute of Athens, Radiation Physics, Materials Technology and Biomedical Imaging Laboratory, Department of Biomedical Engineering, Athens (Greece); Bakas, A. [Technological Educational Institute of Athens, Department of Medical Radiological Technology, Athens (Greece)

    2016-05-15

    In the present work, we demonstrate the fabrication technique of highly translucent layers of nanoparticulated (∝50 nm) LuPO{sub 4}:Eu phosphor, present their basic luminescent properties and give results of their performance in a planar imaging system coupled to a CMOS photodetector. For comparison, the imaging performance of an opaque Gd{sub 2}O{sub 2}S:Eu phosphor screen prepared by sedimentation is also shown. The X-ray detection parameters as well as the luminescence efficiency of the investigated films were discussed. Results show that the in-line transmittance at ∝600-700 nm, in the range of the phosphor luminescence, varies with respect to the thickness of the films from 40 to 50 % for a film of 67 μm thick to 4-12 % when the thickness increases to 460 μm. Yet, X-ray detection parameters get enhanced as the thickness of the films increases. Those results affect the luminescence efficiency curves of the films under poly-energetic X-ray radiation of various tube energies. The normalized noise power spectrum values were found similar for LuPO{sub 4}:Eu films and a phosphor screen made using commercial Gd{sub 2}O{sub 2}S:Eu powder. The detective quantum efficiency of our films is clearly lower compared to the Gd{sub 2}O{sub 2}S:Eu screen from 2 to 10 cycles mm{sup -1} frequency range while the modulation transfer function is lower from 0 to 5.5 cycles mm{sup -1} frequency range. The acquired data allow to predict that high-temperature sintering of our films under pressure may help to improve their imaging quality, since such a processing should increase the luminescence efficiency without significant growth of the grains and thus without sacrificing their translucent character. (orig.)

  15. Design and construction of a computerized optical densitometer for X-ray films; Diseno y construccion de un densitometro optico computarizado para peliculas de rayos-X

    Energy Technology Data Exchange (ETDEWEB)

    Vicuna V, H.G.; Picon C, C.; Zaharia B, M. [Instituto de Enfermedades Neoplasicas, Departamento de Radioterapia, Servicio de Fisica, Av. Angamos Este 2520, Lima 34 (Peru)

    1998-12-31

    In Radiotherapy Departments, where it is disposed of radiation units, these require of a control quality of their parameters as: dose in depth, real size, symmetry and levelling of the radiation field. In order to fulfil above it was designed and built a totally automated system for scanning and analysing the X-ray films or plates, which serve to have the parameter information to be measured. (Author)

  16. Dose-response curve of EBT, EBT2, and EBT3 radiochromic films to synchrotron-produced monochromatic x-ray beams

    CERN Document Server

    Brown, Thomas A D; Alvarez, Diane; Matthews, Kenneth L; Ham, Kyungmin; Dugas, Joseph P; 10.1118/1.4767770

    2012-01-01

    This work investigates the dose-response curves of GAFCHROMIC EBT, EBT2, and EBT3 radiochromic films using synchrotron-produced monochromatic x-ray beams. EBT2 film is being utilized for dose verification in photoactivated Auger electron therapy at the Louisiana State University CAMD synchrotron facility. Monochromatic beams of 25, 30, and 35 keV were generated on the tomography beamline at CAMD. Ion chamber depth-dose measurements were used to determine the dose delivered to films irradiated at depths from 0.7 to 8.5 cm in a 10x10x10-cm3 PMMA phantom. AAPM TG-61 protocol was applied to convert measured ionization into dose. Films were digitized using an Epson 1680 Professional flatbed scanner and analyzed using the net optical density (NOD) derived from the red channel. A dose-response curve was obtained at 35 keV for EBT film, and at 25, 30, and 35 keV for EBT2 and EBT3 films. Calibrations of films for 4 MV x-rays were obtained for comparison using a radiotherapy accelerator at Mary Bird Perkins Cancer Cent...

  17. Self-consistent modelling of X-ray photoelectron spectra from air-exposed polycrystalline TiN thin films

    Science.gov (United States)

    Greczynski, G.; Hultman, L.

    2016-11-01

    We present first self-consistent modelling of x-ray photoelectron spectroscopy (XPS) Ti 2p, N 1s, O 1s, and C 1s core level spectra with a cross-peak quantitative agreement for a series of TiN thin films grown by dc magnetron sputtering and oxidized to different extent by varying the venting temperature Tv of the vacuum chamber before removing the deposited samples. So-obtained film series constitute a model case for XPS application studies, where certain degree of atmosphere exposure during sample transfer to the XPS instrument is unavoidable. The challenge is to extract information about surface chemistry without invoking destructive pre-cleaning with noble gas ions. All TiN surfaces are thus analyzed in the as-received state by XPS using monochromatic Al Kα radiation (hν = 1486.6 eV). Details of line shapes and relative peak areas obtained from deconvolution of the reference Ti 2p and N 1 s spectra representative of a native TiN surface serve as an input to model complex core level signals from air-exposed surfaces, where contributions from oxides and oxynitrides make the task very challenging considering the influence of the whole deposition process at hand. The essential part of the presented approach is that the deconvolution process is not only guided by the comparison to the reference binding energy values that often show large spread, but in order to increase reliability of the extracted chemical information the requirement for both qualitative and quantitative self-consistency between component peaks belonging to the same chemical species is imposed across all core-level spectra (including often neglected O 1s and C 1s signals). The relative ratios between contributions from different chemical species vary as a function of Tv presenting a self-consistency check for our model. We propose that the cross-peak self-consistency should be a prerequisite for reliable XPS peak modelling as it enhances credibility of obtained chemical information, while relying

  18. X-ray Lithography on Perovskite Nanocrystals Films: From Patterning with Anion-Exchange Reactions to Enhanced Stability in Air and Water.

    Science.gov (United States)

    Palazon, Francisco; Akkerman, Quinten A; Prato, Mirko; Manna, Liberato

    2016-01-26

    Films of colloidal CsPbX3 (X = I, Br or Cl) nanocrystals, prepared by solution drop-casting or spin-coating on a silicon substrate, were exposed to a low flux of X-rays from an X-ray photoelectron spectrometer source, causing intermolecular C═C bonding of the organic ligands that coat the surface of the nanocrystals. This transformation of the ligand shell resulted in a greater stability of the film, which translated into the following features: (i) Insolubility of the exposed regions in organic solvents which caused instead complete dissolution of the unexposed regions. This enabled the fabrication of stable and strongly fluorescent patterns over millimeter scale areas. (ii) Inhibition of the irradiated regions toward halide anion exchange reactions, when the films were exposed either to halide anions in solution or to hydrohalic vapors. This feature was exploited to create patterned regions of different CsPbIxBryClz compositions, starting from a film with homogeneous CsPbX3 composition. (iii) Resistance of the films to degradation caused by exposure to air and moisture, which represents one of the major drawbacks for the integration of these materials in devices. (iv) Stability of the film in water and biological buffer, which can open interesting perspectives for applications of halide perovskite nanocrystals in aqueous environments.

  19. Thin film growth of Cd{sub 1-x}Zn{sub x}Te and its application to X-ray sensor

    Energy Technology Data Exchange (ETDEWEB)

    Mochizuki, K.; Takahashi, J.; Nakamura, N. [Department of Information Technology and Electronics, Ishinomaki-Senshu University, 1-Shinmito, Minami-sakai 986-0580 (Japan)

    2015-06-15

    Cd{sub 1-x}Zn{sub x}Te (x∝0.5) thin films with less than 300μm are grown on ITO/glass substrate by Hot-wall and PVT methods, one of the sublimation methods. In order to obtain the films with high resistivity and good quality for X-ray sensor, three attempts have been tried in the experiments. The one is stoichiometry control of CZT (x = 0.04) films, which were grown under controlled Cd vapor pressure. The second is excess chlorine doping to the films (x = 0.04) by controlling CdCl{sub 2} vapor pressure during growth process. The third is to change composition x = 0.04-0.50, which increases band gap. Through these methods, best films with good X-ray response was obtained for the third case of the films with the composition x = 0.20. (copyright 2015 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim)

  20. Studies on strain relaxation of La0.5Ba0.5MnO3 film by normal and grazing incidence X-ray diffraction

    Science.gov (United States)

    Wang, Haiou; Tan, Weishi; Liu, Hao; Cao, Mengxiong; Wang, Xingyu; Ma, Chunlin; Jia, Quanjie

    2017-03-01

    Perovskite manganite La0.5Ba0.5MnO3 (LBMO) films were deposited on (001)-oriented single-crystal SrTiO3 (STO) substrates by pulsed laser deposition. High-resolution X-ray diffraction and grazing incidence X-ray diffraction techniques were applied to characterize the crystal structure and lattice strain of LBMO films. The in-plane and out-of-plane growth orientations of LBMO films with respect to substrate surface have been studied. The epitaxial orientation relationship LBMO (001) [100] //STO (001) [100] exists at the LBMO/STO interface. The lattice strain of LBMO film begins to relax with the thickness of LBMO film up to 12 nm. When the thickness is further increased up to 43 nm, the film is in fully strain-relaxed state. Jahn-Teller strain plays an important role in LBMO/STO system. The mechanism for strain relaxation is in accordance with that of tetragonal distortion.

  1. Temperature and field dependent magnetization in a sub-μm patterned Co/FeRh film studied by resonant x-ray scattering

    Science.gov (United States)

    Lounis, Lounès; Spezzani, Carlo; Delaunay, Renaud; Fortuna, Franck; Obstbaum, Martin; Günther, Stefan; Back, Christian H.; Popescu, Horia; Vidal, Franck; Sacchi, Maurizio

    2016-05-01

    We studied the temperature and field dependence of the magnetization in a Co/FeRh/MgO(0 0 1) film patterned into a matrix of sub-μm sized rectangles, using element selective resonant scattering of polarized soft x-rays. We show that it is possible to reverse partially the magnetization of the Co layer in a thermal cycle that crosses the FeRh antiferromagnetic to ferromagnetic transition. Our results support interest in patterned Co/FeRh films and their potential for achieving temperature induced magnetization switching.

  2. High Field X-ray Diffraction Study for Ni46.4Mn38.8In12.8Co2.0 Metamagnetic Shape Memory Film

    Directory of Open Access Journals (Sweden)

    Yoshifuru Mitsui

    2017-09-01

    Full Text Available The transformation behaviors on metamagnetic shape memory Ni46.4Mn38.8In12.8Co2.0 film were investigated by X-ray diffraction experiments in the temperature up to 473 K and magnetic fields µ0H up to 5 T. The prepared film showed the parent phase with L21 structure at 473 K, and with preferred orientation along the 111 plane. The magnetic field induced reverse transformation was directly observed at T = 366 K, which was just around the reverse transformation starting temperature.

  3. Ferroelectric domains in epitaxial PbxSr1−xTiO3 thin films investigated using X-ray diffraction and piezoresponse force microscopy

    Directory of Open Access Journals (Sweden)

    S. Fernandez-Peña

    2016-08-01

    Full Text Available We present a detailed study of compressively strained PbxSr1−xTiO3 thin films grown by off-axis radio frequency magnetron sputtering on (001-oriented Nb-doped SrTiO3 substrates. Film tetragonality and the ferroelectric critical temperatures are measured for samples of different composition and thickness and compared with a phenomenological Landau-Devonshire model. 180∘ ferroelectric domains are observed using both X-ray diffraction and piezoresponse force microscopy and domain sizes obtained by the two techniques are compared and discussed.

  4. Observation and simulation of hard x ray photoelectron diffraction to determine polarity of polycrystalline zinc oxide films with rotation domains

    OpenAIRE

    Williams, Jesse R.; Píš, Igor; Kobata, Masaaki; Winkelmann, Aimo; Matsushita, Tomohiro; Adachi, Yutaka; Ohashi, Naoki; Kobayashi, Keisuke

    2012-01-01

    X ray photoelectron diffraction (XPD) patterns of polar zinc oxide (ZnO) surfaces were investigated experimentally using hard x rays and monochromatized Cr Kα radiation and theoretically using a cluster model approach and a dynamical Bloch wave approach. We focused on photoelectrons emitted from the Zn 2p3/2 and O 1s orbitals in the analysis. The obtained XPD patterns for the (0001) and (000) surfaces of a ZnO single crystal were distinct for a given emitter and polarity. Polarity determinati...

  5. Soft X-ray emission spectroscopy used for the characterization of a-C and CN{sub x} thin films

    Energy Technology Data Exchange (ETDEWEB)

    Nepijko, S.A., E-mail: nepijko@uni-mainz.de [Institute of Physics, University of Mainz, Staudingerweg 7, 55128 Mainz (Germany); Chernenkaya, A. [Institute of Physics, University of Mainz, Staudingerweg 7, 55128 Mainz (Germany); Graduate School Materials Science in Mainz, Staudingerweg 9, 55128 Mainz (Germany); Medjanik, K.; Chernov, S.V. [Institute of Physics, University of Mainz, Staudingerweg 7, 55128 Mainz (Germany); Klimenkov, M. [Institute for Applied Materials, Karlsruhe Institute of Technology, Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen (Germany); Vlasenko, O.V. [Sumy State University, Rimsky-Korsakov str. 2, 40007 Sumy (Ukraine); Petrovskaya, S.S. [Frantsevich Institute for Problems of Materials Science, National Academy of Sciences of Ukraine, Krzhizhanovsky str. 3, 03142 Kiev (Ukraine); Odnodvorets, L.V. [Sumy State University, Rimsky-Korsakov str. 2, 40007 Sumy (Ukraine); Zaulichnyy, Ya.V. [National Technical University of Ukraine (KPI), Pobedy Av. 37, 03056 Kiev (Ukraine); Schönhense, G. [Institute of Physics, University of Mainz, Staudingerweg 7, 55128 Mainz (Germany)

    2015-02-27

    We present the results of a soft X-ray emission spectroscopy study of a-C and CN{sub x} films on a Si(100) substrate. Also for the characterization of the homogeneity in depth of these films electron energy loss spectroscopy measurements with localization better than 4 nm were carried out. In case of CN{sub x} films the highest diamond-like modification occurs in the region close to the Si(100) substrate. The film density decreases with increasing distance from the substrate and becomes almost constant in range of thicknesses more than ~ 2 nm. - Highlights: • CN{sub x} and a-C film densities decrease with the increase of thickness. • Density increases with the decrease of Si(100) substrate temperature at preparation. • Highest concentration of the diamond-like structure is in the substrate vicinity. • It reduces further from the substrate and stabilizes at thickness ≥ 2 nm.

  6. Study of Synchrotron Radiation Near-Edge X-Ray Absorption Fine-Structure of Amorphous Hydrogenated Carbon Films at Various Thicknesses

    Directory of Open Access Journals (Sweden)

    Sarayut Tunmee

    2015-01-01

    Full Text Available The compositions and bonding states of the amorphous hydrogenated carbon films at various thicknesses were evaluated via near-edge X-ray absorption fine-structure (NEXAFS and elastic recoil detection analysis combined with Rutherford backscattering spectrometry. The absolute carbon sp2 contents were determined to decrease to 65% from 73%, while the hydrogen contents increase from 26 to 33 at.% as the film thickness increases. In addition, as the film thickness increases, the π⁎ (C=C, σ⁎ (C–H, σ⁎ (C=C, and σ⁎ (C≡C bonding states were found to increase, whereas the π⁎ (C≡C and σ⁎ (C–C bonding states were observed to decrease in the NEXAFS spectra. Consequently, the film thickness is a key factor to evaluate the composition and bonding state of the films.

  7. Cross-calibration of Fuji TR image plate and RAR 2492 x-ray film to determine the response of a DITABIS Super Micron image plate scanner

    Science.gov (United States)

    Dunham, G.; Harding, E. C.; Loisel, G. P.; Lake, P. W.; Nielsen-Weber, L. B.

    2016-11-01

    Fuji TR image plate is frequently used as a replacement detector medium for x-ray imaging and spectroscopy diagnostics at NIF, Omega, and Z facilities. However, the familiar Fuji BAS line of image plate scanners is no longer supported by the industry, and so a replacement scanning system is needed. While the General Electric Typhoon line of scanners could replace the Fuji systems, the shift away from photo stimulated luminescence units to 16-bit grayscale Tag Image File Format (TIFF) leaves a discontinuity when comparing data collected from both systems. For the purposes of quantitative spectroscopy, a known unit of intensity applied to the grayscale values of the TIFF is needed. The DITABIS Super Micron image plate scanning system was tested and shown to potentially rival the resolution and dynamic range of Kodak RAR 2492 x-ray film. However, the absolute sensitivity of the scanner is unknown. In this work, a methodology to cross calibrate Fuji TR image plate and the absolutely calibrated Kodak RAR 2492 x-ray film is presented. Details of the experimental configurations used are included. An energy dependent scale factor to convert Fuji TR IP scanned on a DITABIS Super Micron scanner from 16-bit grayscale TIFF to intensity units (i.e., photons per square micron) is discussed.

  8. Cross-calibration of Fuji TR image plate and RAR 2492 x-ray film to determine the response of a DITABIS Super Micron image plate scanner

    Energy Technology Data Exchange (ETDEWEB)

    Dunham, G., E-mail: gsdunha@sandia.gov; Harding, E. C.; Loisel, G. P.; Lake, P. W.; Nielsen-Weber, L. B. [Sandia National Laboratories, Albuquerque, New Mexico 87185 (United States)

    2016-11-15

    Fuji TR image plate is frequently used as a replacement detector medium for x-ray imaging and spectroscopy diagnostics at NIF, Omega, and Z facilities. However, the familiar Fuji BAS line of image plate scanners is no longer supported by the industry, and so a replacement scanning system is needed. While the General Electric Typhoon line of scanners could replace the Fuji systems, the shift away from photo stimulated luminescence units to 16-bit grayscale Tag Image File Format (TIFF) leaves a discontinuity when comparing data collected from both systems. For the purposes of quantitative spectroscopy, a known unit of intensity applied to the grayscale values of the TIFF is needed. The DITABIS Super Micron image plate scanning system was tested and shown to potentially rival the resolution and dynamic range of Kodak RAR 2492 x-ray film. However, the absolute sensitivity of the scanner is unknown. In this work, a methodology to cross calibrate Fuji TR image plate and the absolutely calibrated Kodak RAR 2492 x-ray film is presented. Details of the experimental configurations used are included. An energy dependent scale factor to convert Fuji TR IP scanned on a DITABIS Super Micron scanner from 16-bit grayscale TIFF to intensity units (i.e., photons per square micron) is discussed.

  9. Imaging characteristics of intraocular foreign bodies: a comparative study of plain film X-ray, computed tomography, ultrasound, and magnetic resonance imaging.

    Science.gov (United States)

    Modjtahedi, Bobeck S; Rong, Andrew; Bobinski, Mathew; McGahan, John; Morse, Lawrence S

    2015-01-01

    To determine the imaging features of common intraocular foreign bodies (IOFBs) and the ability to differentiate types of IOFBs. Four-mm IOFBs were inserted via through pars plana approach into cadaveric lamb eyes. Six metallic (aluminum, brass, copper, silver, steel, and lead) and seven nonmetallic (plastic [CF6 spectacle plastic and polyvinyl chloride pipe], glass [bottle glass and windshield glass], wood [dry and wet poplar], and stone [slate]) IOFBs were imaged using plain film x-ray, computed tomography scan, ultrasound, and magnetic resonance imaging (T1, T2, and gradient echo sequences). Plain film x-ray had limited ability to differentiate most IOFBs. Computed tomography findings can be divided into low attenuation objects (wood), moderate attenuation (CF6 spectacle plastic), high attenuation without surrounding artifact (polyvinyl chloride, slate, bottle glass, windshield glass, and aluminum), high attenuation with shadow artifact and minimal edge streak artifact (steel, brass, copper), and high attenuation with significant shadow artifact and prominent streak artifact (silver and lead). Density (in Hounsfield units) aided in differentiating the types of IOFBs. Gradient echo sequences on magnetic resonance imaging also held utility. Ultrasound images had considerable overlap in appearances. Imaging techniques can significantly aid in determining the IOFBs type, with computed tomography serving as the best initial modality. X-ray holds limited utility while ultrasound and magnetic resonance imaging are best reserved as adjunctive tests.

  10. Cross-calibration of Fuji TR image plate and RAR 2492 x-ray film to determine the response of a DITABIS Super Micron image plate scanner.

    Science.gov (United States)

    Dunham, G; Harding, E C; Loisel, G P; Lake, P W; Nielsen-Weber, L B

    2016-11-01

    Fuji TR image plate is frequently used as a replacement detector medium for x-ray imaging and spectroscopy diagnostics at NIF, Omega, and Z facilities. However, the familiar Fuji BAS line of image plate scanners is no longer supported by the industry, and so a replacement scanning system is needed. While the General Electric Typhoon line of scanners could replace the Fuji systems, the shift away from photo stimulated luminescence units to 16-bit grayscale Tag Image File Format (TIFF) leaves a discontinuity when comparing data collected from both systems. For the purposes of quantitative spectroscopy, a known unit of intensity applied to the grayscale values of the TIFF is needed. The DITABIS Super Micron image plate scanning system was tested and shown to potentially rival the resolution and dynamic range of Kodak RAR 2492 x-ray film. However, the absolute sensitivity of the scanner is unknown. In this work, a methodology to cross calibrate Fuji TR image plate and the absolutely calibrated Kodak RAR 2492 x-ray film is presented. Details of the experimental configurations used are included. An energy dependent scale factor to convert Fuji TR IP scanned on a DITABIS Super Micron scanner from 16-bit grayscale TIFF to intensity units (i.e., photons per square micron) is discussed.

  11. Evaluating performance characteristics of x-ray equipment and film systems without the use of electronic measurement and/or special instruments

    Energy Technology Data Exchange (ETDEWEB)

    Bianchi, M.F. [Avio, Rivalta, Rivalta, Torino (Italy); DeNitto, C. [Avio, Brindisi (Italy); Liscio, A. [Avio, Rivalta, Rivalta, Torino (Italy); Scala, N. [Avio, Pomigliano d' Arco, NA (Italy)

    2004-07-01

    Measurement and control of characteristics of NDT equipment and system that produce output to be interpreted by inspector is one of the most important tools for NDT reliability. Control activity should be based on: initial accurate measurement and calibration; periodical check to assure maintenance of calibration status; and, immediate verification and corrective action when any malfunctioning is suspected. 'Self-calibration' intended as capability of NDT facility to calibrate and control its own equipment and systems is very important for continuous and reliable activity. Typical approach based on this philosophy is ASTM E317 'Standard Practice for Evaluating Performance Characteristics of Ultrasonic Pulse-Echo Examination Instruments and Systems Without the Use of Electronic Measurement Instruments' that is applicable to shop or field conditions. Is 'Self-calibration' applicable to radiographic system too? Many characteristics can be self-determined according to existing practices and methods, but other ones require assistance and cooperation of supplier both for film system and x-ray equipment. A certified film system being controlled by pre-exposed filmstrips can be adopted as 'measurement device' for X-ray output concerning both intensity and contrast. Basically x-ray equipment manufacturer performs initial accurate measurement and calibration using electronic measurement and/or special instrumentation as necessary. Then specific film set on 'low-price' blocks and specimens is produced according to standard practice whose guidelines are supplied by this paper. Film set, blocks, specimens and results referred to specific film system will be the reference kit for periodical check in NDT facility. This paper supplies some guidelines for standard practice based on testing using mainly GE Inspection Technologies radiographic system being available in Avio facilities. (author)

  12. Bone X-Ray (Radiography)

    Medline Plus

    Full Text Available ... small burst of radiation that passes through the body, recording an image on photographic film or a special detector. Different ... This ensures that those parts of a patient's body not being imaged receive minimal radiation ... x-ray images are among the clearest, most detailed views of ...

  13. Bone X-Ray (Radiography)

    Medline Plus

    Full Text Available ... and places the x-ray film holder or digital recording plate under the table in the area of the body being imaged. When necessary, sandbags, pillows or other positioning devices will be used to help you maintain the ...

  14. Extremity x-ray

    Science.gov (United States)

    ... degenerative) Bone tumor Broken bone (fracture) Dislocated bone Osteomyelitis (infection) Arthritis Other conditions for which the test ... Bone tumor Bone x-ray Broken bone Clubfoot Osteomyelitis X-ray Review Date 7/3/2016 Updated ...

  15. 骨科X线片的翻拍技术%Analysis Orthopedics X-ray Film Remake Technique

    Institute of Scientific and Technical Information of China (English)

    李燕

    2015-01-01

    The hospital is a comprehensive hospital in the Department of orthopedics, every day a large number of patients for x-ray. In order to need medical treatment, teaching, scientific research and publication, wil be copied into the slide and X-ray photograph this is a work of medical photography, in order to reproduce the original appearance of X-ray, X-ray photography technology personnel must have the perfect remake technique and can deal with dif erent quality, to create a perfect photograph or slide for the doctor in scientific research, teaching, publishing selection. How to take good X-ray, is to continue to explore the issue, I summarized some experience and experience report to everybody in the photography work, please.%我院是以骨科为主的综合性医院,每天为患者拍大量的X线片。为了医疗、教学、科研出版的需要,将X线片复制成幻灯及照片这是医学摄影的一项工作,为了再现X线片的原貌,摄影技术人员要有过硬的翻拍技术并能处理不同质量的X线片,将其制作成一张完美的像片或幻灯供医生在科研、教学、出版选用。怎样拍好X线片,是不断探讨的问题,本人在摄影工作中总结了一些经验和体会汇报给大家,请予以指正。

  16. X-ray Photoelectron Spectroscopic Study on Electrochromic Molybdenum Oxide Films%MoO3电致变色薄膜的XPS研究

    Institute of Scientific and Technical Information of China (English)

    章俞之; 快素兰; 黄银松; 王忠春; 胡行方

    2001-01-01

    Molybdenum oxide films were fabricated successfully by spincoating from Li+-doped peroxo polymolybdate solution via sol-gel technique.Their electrochemical and electrochromic properties were investigated by cyclic voltammetry and in-situ UV transmittance measurements.The results showed that the films possessed excellent electrochemical stability and reversibility.The electrochromic mechanism of the MoO3 was discussed by using results obtained from X-ray photoelectron spectroscopy (XPS).The results showed that the most part of the Mo6+ in MoO3 film was reduced to Mo5+ and Mo4+ ions during the Li+ intercalation process,Mo4+ was oxidized to Mo5+ and part of Mo5+ was oxidized to Mo6+ again during the Li+ deintercalation process.So it was considered that Mo4+ ions existed in the colored MoO3 films.

  17. Extended x-ray absorption fine structure measurements on radio frequency magnetron sputtered HfO2 thin films deposited with different oxygen partial pressures.

    Science.gov (United States)

    Maidul Haque, S; Nayak, C; Bhattacharyya, Dibyendu; Jha, S N; Sahoo, N K

    2016-03-20

    Two sets of HfO2 thin film have been deposited by the radio frequency magnetron sputtering technique at various oxygen partial pressures, one set without any substrate bias and another set with a 50 W pulsed dc substrate bias. The films have been characterized by extended x-ray absorption fine structure (EXAFS) measurements at the Hf L3 edge, and the structural information obtained from analysis of the EXAFS data has been used to explain the macroscopic behavior of the refractive index obtained from spectroscopic ellipsometry measurements. It has been observed that the variation of refractive index with oxygen partial pressure depends on the Hf-Hf bond length for the set of films deposited without substrate bias, while for the other set of films deposited with pulsed dc substrate bias, it depends on the oxygen coordination of the nearest neighbor shell surrounding Hf sites.

  18. X-ray diffraction study of the molecular propolis films deposited from an alcohol solution onto the cleavage surfaces of layered V2VI3 compounds

    Science.gov (United States)

    Drapak, S. I.; Gavrylyuk, S. V.; Kaminskii, V. M.; Kovalyuk, Z. D.

    2008-09-01

    The structures of the molecular propolis films deposited from an alcohol solution on the (0001) cleavage surface of layered bismuth selenide and telluride are studied by X-ray diffraction. Despite the chemical interaction between the semiconductor substrates and the organic-substance components, the molecular structural ordering of the propolis films is shown to be identical to that in the films of this substance on the surface of amorphous glass substrates. The chemical and deformation interaction between the organic substance and the layered V2VI3 compounds is found to result in the formation of an organic-inorganic sandwich nanostructure at a distance of ˜0.3 μm from the layered crystal-propolis film interface.

  19. Structural investigations of doped GaN-films with X-ray standing waves; Strukturelle Untersuchungen dotierter GaN-Filme mit stehenden Roentgenwellenfeldern

    Energy Technology Data Exchange (ETDEWEB)

    Siebert, M.

    2006-10-30

    In this thesis, the incorporation of Mg and Si in GaN-films grown on (0001)-sapphire substrates is investigated in detail by applying several synchrotron radiation techniques. The segregational behavior of Si and Mg is investigated by X-ray-photoelectron-spectroscopy (XPS) and XPS-microscopy. For the first time, it is revealed that also Si segregates to the surface and stabilizes surface facets along high-symmetry directions. Additionally, it is found that Mg also segregates to the crystal surface at concentrations far below the threshold condition for the formation of pyramidal defects. For the first time, the technique of X-ray standing waves (XSW), which allows to directly conclude on the crystal and defect structure on the atomic scale, is successfully applied to thick crystals with high defect density. In order to compensate for the high crystal mosaicity of GaN, which significantly reduces the accuracy of the XSW-measurements, the experiments were performed in near-backscattering geometry, as in this setup the intrinsic reflection width becomes large as compared to the tilt mosaicity. Influences of doped crystal material are suppressed by using a thick undoped high quality GaN-film for the formation of a standing wave field, which is used for the investigation of a thin doped film deposited on top. By performing the XSW measurements with probe signals of different surface sensitivity (fluorescence and photoelectrons) the incorporation behavior within the bulk crystal is compared to regions close to the surface. Within this thesis a technique is suggested that allows to determine the non-dipole contributions to the yield by comparing Auger electron and photoelectron secondary signals. The XSW-measurements on Si-doped samples reveal that Si is solely incorporated on substitutional Ga-sites both within the bulk crystal and close to the surface. In the bulk, Si is homogeneously distributed, distorting the crystal lattice in their vicinity. At the surface Si is

  20. X-ray magnetic spectroscopy of MBE-grown Mn-doped Bi{sub 2}Se{sub 3} thin films

    Energy Technology Data Exchange (ETDEWEB)

    Collins-McIntyre, L. J.; Watson, M. D.; Zhang, S. L.; Coldea, A. I.; Hesjedal, T., E-mail: Thorsten.Hesjedal@physics.ox.ac.uk [Department of Physics, Clarendon Laboratory, University of Oxford, Oxford, OX1 3PU (United Kingdom); Baker, A. A. [Department of Physics, Clarendon Laboratory, University of Oxford, Oxford, OX1 3PU (United Kingdom); Magnetic Spectroscopy Group, Diamond Light Source, Didcot, OX11 0DE (United Kingdom); Harrison, S. E. [Department of Electrical Engineering, Stanford University, Stanford, California 94305 (United States); Pushp, A.; Kellock, A. J.; Parkin, S. S. P. [IBM Almaden Research Center, 650 Harry Road, San Jose, California 95120 (United States); Laan, G. van der [Magnetic Spectroscopy Group, Diamond Light Source, Didcot, OX11 0DE (United Kingdom)

    2014-12-15

    We report the growth of Mn-doped Bi{sub 2}Se{sub 3} thin films by molecular beam epitaxy (MBE), investigated by x-ray diffraction (XRD), atomic force microscopy (AFM), SQUID magnetometry and x-ray magnetic circular dichroism (XMCD). Epitaxial films were deposited on c-plane sapphire substrates by co-evaporation. The films exhibit a spiral growth mechanism typical of this material class, as revealed by AFM. The XRD measurements demonstrate a good crystalline structure which is retained upon doping up to ∼7.5 atomic-% Mn, determined by Rutherford backscattering spectrometry (RBS), and show no evidence of the formation of parasitic phases. However an increasing interstitial incorporation of Mn is observed with increasing doping concentration. A magnetic moment of 5.1 μ{sub B}/Mn is obtained from bulk-sensitive SQUID measurements, and a much lower moment of 1.6 μ{sub B}/Mn from surface-sensitive XMCD. At ∼2.5 K, XMCD at the Mn L{sub 2,3} edge, reveals short-range magnetic order in the films and indicates ferromagnetic order below 1.5 K.

  1. Effective Contact Potential of Thin Film Metal-Insulator Nanostructures and Its Role in Self-Powered Nanofilm X-ray Sensors.

    Science.gov (United States)

    Brivio, Davide; Ada, Earl; Sajo, Erno; Zygmanski, Piotr

    2017-03-29

    We studied the effective contact potential difference (ECPD) of thin film nanostructures and its role in self-powered X-ray sensors, which use the high-energy current detection scheme. We compared the response to kilovoltage X-rays of several nanostructures made of disparate combinations of conductors (Al, Cu, Ta, ITO) and oxides (SiO2, Ta2O5, Al2O3). We measured current-voltage curves in parallel-plate configuration separated by an air gap and determined three characteristic parameters: current at zero voltage bias I0, the voltage offset for zero current ECPD, and saturation current Isat. We found that the metals' ECPD values measured with our technique were higher than the CPD values measured with photoelectron spectroscopy in situ, i.e., no air contact. These differences are related to natural oxidization and to the presence of photo-/Auger-electron current leaking from the high-Z toward the low-Z electrode, as suggested by additional experiments carried out in vacuum. Further, the deposition of the 40-500 nm oxide layer on the surface of metallic substrates strongly affects their contact potential. This technique exploits ionization and charge carrier transport in both solid insulators and in air, and it opens the possibility of measuring the ECPD between metals separated by a solid insulator in a metal-insulator-metal (MIM) configuration. Additionally, we demonstrated that certain configurations of MIM structures are suitable for X-ray detection in self-powered mode.

  2. X-Ray Supernovae

    CERN Document Server

    Immler, S; Immler, Stefan; Lewin, Walter H.G.

    2002-01-01

    We present a review of X-ray observations of supernovae (SNe). By observing the (~0.1--100 keV) X-ray emission from young SNe, physical key parameters such as the circumstellar matter (CSM) density, mass-loss rate of the progenitor and temperature of the outgoing and reverse shock can be derived as a function of time. Despite intensive search over the last ~25 years, only 15 SNe have been detected in X-rays. We review the individual X-ray observations of these SNe and discuss their implications as to our understanding of the physical processes giving rise to the X-ray emission.

  3. PROCEEDINGS ON SYNCHROTRON RADIATION: In-situ monitoring of EuTiO3 and SrTiO3 film growth using time-resolved X-ray scattering during pulsed-laser deposition

    Science.gov (United States)

    Wang, Huan-Hua

    2009-11-01

    Time-resolved X-ray scattering was employed to in-situ monitor the epitaxial growth process of the thin films and multilayers of EuTiO3 and SrTiO3 during pulsed laser deposition. The temporal intensity oscillations of the reflected X-rays at anti-Bragg position and the transient processes following the flux pulses were observed. The temporal intensity oscillations were used to control the film thickness, and the reflectivity along the crystal truncation rod was used to measure both the film thickness and the surface/interface roughness. The primary features of the X-ray intensity oscillations were reproduced via simulating the experimental data using diffusive rate equation model. Several mechanisms of determining the X-ray intensity features were discerned.

  4. Synchrotron X-Ray Study of Melting in Submonolayer Ar and other Rare-Gas Films on Graphite

    DEFF Research Database (Denmark)

    McTague, J. P.; Als-Nielsen, Jens Aage; Bohr, Jakob;

    1982-01-01

    Synchrotron x-ray diffraction studies of the (10) peak of Ar on the (001) surface of ZYX graphite show a sharp but continuous broadening of the Bragg peak with increasing temperature. Below a coverage of ∼ 1 Ar atom per six surface carbon atoms (ρ=1) the onset of this transition occurs at a cover...... at a coverage-independent temperature T=47.9 K. We interpret this point as a critical end point for melting. For coverages 0.94...

  5. Stress evaluation in thin films: Micro-focus synchrotron X-ray diffraction combined with focused ion beam patterning for d{sub o} evaluation

    Energy Technology Data Exchange (ETDEWEB)

    Baimpas, Nikolaos, E-mail: nikolaos.baimpas@eng.ox.ac.uk [University of Oxford, Dept. of Engineering Science (United Kingdom); Le Bourhis, Eric [University of Poitiers, Institut P' , Laboratoire de Physique des Matériaux, Poitiers (France); Eve, Sophie [ENSICAEN, CRISMAT, Caen (France); Thiaudière, Dominique [Synchrotron SOLEIL, L' Orme des Merisiers Saint-Aubin, Paris (France); Hardie, Christopher [University of Oxford, Materials Department (United Kingdom); Korsunsky, Alexander M. [University of Oxford, Dept. of Engineering Science (United Kingdom)

    2013-12-31

    Nanocrystalline metallic coatings of sub-micron thickness are widely used in modern microelectronic applications. In X-ray diffraction experiments to determine both the residual and applied stresses in nanocrystalline coatings, one difficult challenge that comes up invariably is the determination of the strain-free lattice spacing d{sub o}. The present study addresses this challenge by using the focused ion beam (FIB) to generate a built-in strain-free reference by patterning (milling) a 50 × 50 μm{sup 2} region of the coating to produce an array of small stress-relieved “islands” ∼ 0.8 × 0.8 μm{sup 2} each. Transmission X-ray diffraction setup was used for data collection at DIFFABS beamline (Synchrotron SOLEIL, France). A 150 nm-thick multi-layered W–Cu nano-composite thin film on polyimide (Kapton®) substrate was studied. The samples were loaded incrementally using a compact uniaxial loading device, and micro-beam diffraction data were collected on and away from the reference array. It was shown experimentally that the “island” array remained approximately strain free throughout the experiment, providing an on-board d{sub o} lattice spacing reference. The changing lattice spacing d in the coating was also monitored away from the array, to deduce the elastic strain evolution during deformation. The results and their implications are presented and discussed. - Highlights: • In situ deformation study of laminate polycrystalline W–Cu thin films • Focused ion beam (FIB) patterning of an array of “islands” on thin films surface • X-ray diffraction on island-patterned region • Constant strain on “islands” independently of the deformation of the substrate.

  6. X-ray photoelectron spectroscopy studies of Ag-doped thin amorphous Ge{sub x}Sb{sub 40-x}S{sub 60} films

    Energy Technology Data Exchange (ETDEWEB)

    Debnath, R.K.; Fitzgerald, A.G.; Christova, K

    2002-12-30

    X-ray photoelectron spectroscopy has been used to determine the binding energies of the core electrons in Ag-doped amorphous thin Ge{sub x}Sb{sub 40-x}S{sub 60} films (x=15, 20, 25 and 27). Chemical shifts of the constituent elements have revealed that electrons are transferred from chalcogenide to metal and compounds such as Ag{sub 2}S and Ag{sub 2}O are likely to foue to photo-induced chemical modification and oxidation, respectively. Charge defects are induced in the amorphous system.

  7. Kramers-Kronig analysis of soft x-ray reflectivity data of platinum thin film in 40-200 Å wavelength region

    Science.gov (United States)

    Sharma, Saurabh; Gupta, R. K.; Sinha, Mangalika; Yadav, P.; Singh, Amol; Modi, Mohammed H.

    2016-05-01

    Reflectivity beamline at Indus-1 synchrotron source is used to determine optical constants of a platinum thin film in the soft x-ray wavelength region of 40-200Å by applying Kramers-Kronig (KK) technique on R vs wavelength data. Upto 150Å wavelength region the results of KK analysis are found in good agreement with the Henke's optical constants and also with those obtained by the angle dependent reflectivity technique. A significant mismatch is observed above 150Å wavelength region which could be due to the presence of higher harmonics in the toroidal grating spectra of the reflectivity beamline.

  8. Morphology of F8T2/PC71BM Blend Film as Investigated by Scanning Transmission X-ray Microscope (STXM)

    OpenAIRE

    Moritomo, Yutaka; Yonezawa, Kouhei; Sakurai, Takeaki; Yasuda, Takeshi; Takeichi, Yasuo; Kamioka, Hayato; Suga, Hiroki; Takahashi, Yoshio; Yoshida, Yuji; Inami, Nobuhito; Mase, Kazuhiko; Ono, Kanta

    2015-01-01

    Clarification of the morphology of bulk heterojunction (BHJ) is indispensable for true comprehension of the organic solar cells. Here, we performed scanning transmission X-ray microscopy (STXM) for a poly-(9,9-dioctylfluorene-co-bithiophene) (F8T2)/[6,6]-phenyl C71-butyric acid methyl ester (PC71BM) blend film annealed at various temperatures (Tan). We found that the fullerene concentration within the polymer-rich domain decreases with Tan while the domain size (∼230 nm) is essentially unchan...

  9. X-ray Spectroscopy of Ultra-thin Oxide/oxide Heteroepitaxial Films: A Case Study of Single-nanometer VO2/TiO2

    Energy Technology Data Exchange (ETDEWEB)

    Quackenbush, Nicholas F. [Binghamton Univ., NY (United States); Paik, Hanjong [Cornell Univ., Ithaca, NY (United States); Woicik, Joseph C. [National Inst. of Standards and Technology (NIST), Gaithersburg, MD (United States); Arena, Dario A. [Brookhaven National Lab. (BNL), Upton, NY (United States); Schlom, Darrell G. [Cornell Univ. and Kavli Inst. at Cornell for Nanoscale Science, Ithaca, NY (United States); Piper, Louis F. J. [Binghamton Univ., NY (United States)

    2015-08-21

    Epitaxial ultra-thin oxide films can support large percent level strains well beyond their bulk counterparts, thereby enabling strain-engineering in oxides that can tailor various phenomena. At these reduced dimensions (typically < 10 nm), contributions from the substrate can dwarf the signal from the epilayer, making it difficult to distinguish the properties of the epilayer from the bulk. This is especially true for oxide on oxide systems. Here, we have employed a combination of hard X-ray photoelectron spectroscopy (HAXPES) and angular soft X-ray absorption spectroscopy (XAS) to study epitaxial VO2/TiO2 (100) films ranging from 7.5 to 1 nm. We observe a low-temperature (300 K) insulating phase with evidence of vanadium-vanadium (V-V) dimers and a high-temperature (400 K) metallic phase absent of V-V dimers irrespective of film thickness. Results confirm that the metal insulator transition can exist at atomic dimensions and that biaxial strain can still be used to control the temperature of its transition when the interfaces are atomically sharp. Generally, our case study highlights the benefits of using non-destructive XAS and HAXPES to extract out information regarding the interfacial quality of the epilayers and spectroscopic signatures associated with exotic phenomena at these dimensions.

  10. X-ray scattering study of thin films of poly(2,5-bis(3-alkylthiophen-2-yl)thieno[3,2-b]thiophene).

    Science.gov (United States)

    Chabinyc, Michael L; Toney, Michael F; Kline, R Joseph; McCulloch, Iain; Heeney, Martin

    2007-03-21

    Poly(2,5-bis(3-alkylthiophen-2-yl)thieno[3,2-b]thiophene), PBTTT, is a semiconducting polymer that forms thin film transistors (TFTs) with high field effect mobility on silicon dioxide dielectrics that are treated with alkyltrichlorosilanes ( approximately 0.2 to 0.5 cm2/V s) but forms TFTs with poor mobility on bare silicon dioxide (thin films of PBTTT on these surfaces was studied using synchrotron X-ray diffraction and atomic force microscopy. PBTTT crystallizes with lamellae of pi-stacked polymer chains on both surfaces. The crystalline domains are well-oriented relative to the substrate in the as-spun state and become highly oriented and more ordered with thermal annealing in the liquid crystalline mesophase. Although the X-ray scattering from PBTTT is nearly identical on both surfaces, atomic force microscopy showed that the domain size of the crystalline regions depends on the substrate surface. These results suggest that electrical transport in PBTTT films is strongly affected by the domain size of the crystalline regions and the disordered regions between them.

  11. Elemental depth profiling of Cu(In,Ga)Se{sub 2} thin films by reference-free grazing incidence X-ray fluorescence analysis

    Energy Technology Data Exchange (ETDEWEB)

    Streeck, C., E-mail: cornelia.streeck@helmholtz-berlin.d [Helmholtz-Zentrum Berlin fuer Materialien und Energie GmbH, Hahn-Meitner-Platz 1, Institut Technologie, 14109 Berlin (Germany); Technische Universitaet Berlin, Institut fuer Optik und Atomare Physik, Hardenbergstr. 36, 10623 Berlin (Germany); Beckhoff, B.; Reinhardt, F.; Kolbe, M. [Physikalisch-Technische Bundesanstalt, Abbestr. 2-12, 10587 Berlin (Germany); Kanngiesser, B. [Technische Universitaet Berlin, Institut fuer Optik und Atomare Physik, Hardenbergstr. 36, 10623 Berlin (Germany); Kaufmann, C.A.; Schock, H.W. [Helmholtz-Zentrum Berlin fuer Materialien und Energie GmbH, Hahn-Meitner-Platz 1, Institut Technologie, 14109 Berlin (Germany)

    2010-02-15

    The semiconductor band gap of the Cu(In,Ga)Se{sub 2} (CIGSe) compound can be varied by the In to Ga ratio. This composition variation determines the photovoltaic properties of CIGSe thin films. Their composition depth profile has to be optimized in order to obtain maximum efficiencies in solar cell applications. Synchrotron-radiation-based X-ray fluorescence (XRF) analysis under grazing incidence conditions provides non-destructive access to the compositional depth profile of the CIGSe thin films and, hence, represents a new non-destructive method, which does not require well-characterized standards for calibration purposes. Based on an analytical description of the physical processes, fluorescence line intensities of the specimen can be calculated by using fundamental atomic parameters. The general suitability of the method for determining depth gradients in CIGSe thin films is first shown by calculations. Reference-free XRF test measurements were carried out at the FCM beamline in the PTB laboratory at BESSY II. X-ray fluorescence was induced by photon excitation at energies of 4.0 keV and 10.5 keV, respectively, using various shallow incident angles. The calculations and the experimental measurements show that even small differences in the Ga/In profile may be distinguished, indicating that grazing incidence XRF is a promising tool for a non-destructive characterization of compositional depth profiles. Further refinement of the operational parameters may contribute to the sensitivity of the method.

  12. Elemental depth profiling of Cu(In,Ga)Se 2 thin films by reference-free grazing incidence X-ray fluorescence analysis

    Science.gov (United States)

    Streeck, C.; Beckhoff, B.; Reinhardt, F.; Kolbe, M.; Kanngießer, B.; Kaufmann, C. A.; Schock, H. W.

    2010-02-01

    The semiconductor band gap of the Cu(In,Ga)Se 2 (CIGSe) compound can be varied by the In to Ga ratio. This composition variation determines the photovoltaic properties of CIGSe thin films. Their composition depth profile has to be optimized in order to obtain maximum efficiencies in solar cell applications. Synchrotron-radiation-based X-ray fluorescence (XRF) analysis under grazing incidence conditions provides non-destructive access to the compositional depth profile of the CIGSe thin films and, hence, represents a new non-destructive method, which does not require well-characterized standards for calibration purposes. Based on an analytical description of the physical processes, fluorescence line intensities of the specimen can be calculated by using fundamental atomic parameters. The general suitability of the method for determining depth gradients in CIGSe thin films is first shown by calculations. Reference-free XRF test measurements were carried out at the FCM beamline in the PTB laboratory at BESSY II. X-ray fluorescence was induced by photon excitation at energies of 4.0 keV and 10.5 keV, respectively, using various shallow incident angles. The calculations and the experimental measurements show that even small differences in the Ga/In profile may be distinguished, indicating that grazing incidence XRF is a promising tool for a non-destructive characterization of compositional depth profiles. Further refinement of the operational parameters may contribute to the sensitivity of the method.

  13. Multiple scattering in grazing-incidence X-ray diffraction: impact on lattice-constant determination in thin films.

    Science.gov (United States)

    Resel, Roland; Bainschab, Markus; Pichler, Alexander; Dingemans, Theo; Simbrunner, Clemens; Stangl, Julian; Salzmann, Ingo

    2016-05-01

    Dynamical scattering effects are observed in grazing-incidence X-ray diffraction experiments using an organic thin film of 2,2':6',2''-ternaphthalene grown on oxidized silicon as substrate. Here, a splitting of all Bragg peaks in the out-of-plane direction (z-direction) has been observed, the magnitude of which depends both on the incidence angle of the primary beam and the out-of-plane angle of the scattered beam. The incident angle was varied between 0.09° and 0.25° for synchrotron radiation of 10.5 keV. This study reveals comparable intensities of the split peaks with a maximum for incidence angles close to the critical angle of total external reflection of the substrate. This observation is rationalized by two different scattering pathways resulting in diffraction peaks at different positions at the detector. In order to minimize the splitting, the data suggest either using incident angles well below the critical angle of total reflection or angles well above, which sufficiently attenuates the contributions from the second scattering path. This study highlights that the refraction of X-rays in (organic) thin films has to be corrected accordingly to allow for the determination of peak positions with sufficient accuracy. Based thereon, a reliable determination of the lattice constants becomes feasible, which is required for crystallographic structure solutions from thin films.

  14. Enzymatic hydrolysis of gelatin layers of X-Ray films and release of silver particles using keratinolytic serine proteases from Purpureocillium lilacinum LPS # 876.

    Science.gov (United States)

    Cavello, Ivana Alejandra; Hours, Roque Alberto; Cavalitto, Sebastián Fernando

    2013-08-01

    Enzymatic decomposition of gelatin layers on used X-ray films and repeated utilization of the enzyme for potential application in silver recovery were investigated using keratinolytic serine proteases from Purpureocillium lilacinum LPS # 876. At pH 9.0, the enzymatic reaction was enhanced by the increase of enzyme concentration or by the increase of the temperature up to 60℃. Under the conditions of 6.9 U/ml, 60℃, and pH 9.0, hydrolysis of the gelatin layers and the resulting release of silver particles were achieved within 6 min. The protective effect of polyols against thermal denaturation was investigated. The presence of glycerol and propylene glycol increased enzyme stability. When the reusability of the enzyme for gelatin hydrolysis was tested, it could be seen that it could be effectively reused for more cycles when glycerol was added, compared with the enzyme without protective agents. The results of these repeated treatments suggested that a continuous process of recycling silver from used X-ray is feasible. Keeping in mind that recycling is (at the present time) needed and imperative, it can be remarked that, in this research, three wastes were successfully used: hair waste in order to produce serine proteases; glycerol in order to enhance enzyme thermal stability; and used Xray films in order to recover silver and PET films.

  15. Spin transitions in La0.7 Ba0.3CoO3 thin films revealed by combining Raman spectroscopy and X-ray diffraction

    Science.gov (United States)

    Othmen, Zied; Copie, Olivier; Daoudi, Kais; Boudard, Michel; Gemeiner, Pascale; Oueslati, Meherzi; Dkhil, Brahim

    2016-07-01

    In cobaltite, the spin states transitions of Co3+/4+ ions govern the magnetic and electronic conduction properties. These transitions are strain-sensitive and can be varied using external parameters, including temperature, hydrostatic pressure, or chemical stresses through ionic substitutions. In this work, using temperature dependent Raman spectroscopy and X-ray diffraction, the epitaxial strain effects on both structural and vibrational properties of La0.7 Ba0.3 CoO3 (LBCO) cobaltite thin films are investigated. All Raman active phonon modes as well as the structure are found to be strongly affected. Both Raman modes and lattice parameter evolutions show temperature changes correlated with magnetic and electronic transitions properties. Combining Raman spectroscopy and X-ray diffraction appears as a powerful approach to probe the spin transition in thin film cobaltite. Our results provide insight into strong spin-charge-phonon coupling in LBCO thin film. This coupling manifests as vibrational transition with temperature in the Raman spectra near the ferromagnetic spin ordered transition at 220 K.

  16. Scanning electron microscopy and energy-dispersive X-ray microanalysis studies of early dental calculus on resin plates exposed to human oral cavities.

    Science.gov (United States)

    Kodaka, T; Ohohara, Y; Debari, K

    1992-06-01

    Dental calculus formed after 10 days on resin plates, applied to the lingual sides of the mandibular gingival regions in eight human subjects, was investigated by means of scanning electron microscopy (SEM) and energy-dispersive X-ray microanalysis (EDX). The mineral deposits were mainly divided into three types: A, B, and C. The type A deposits showing an average Ca/P molar ratio of 1.42 were densely packed with fine needle-shaped crystals formed by the intra- and extra-cellular calcification. The type A deposits, probably composed of Ca-deficient apatites and the transitional forms between apatite and octacalcium phosphate (OCP), were observed in all subjects. The type B deposits showing an average Ca/P molar ratio of 0.96 were aggregated with polygonal column, triangular plate-shaped, and rhombohedral crystals. These crystals identified as brushite (CaHPO4-2H2O:dicalcium phosphate dihydrate: DCPD) were found in four subjects. Platelet-shaped crystals of the type C deposits were observed in three subjects. Their Ca/P molar ratio of 1.26 and the crystal shape were similar to those of OCP. Whitlockite crystals were not found although Mg-containing hexagonal disk-like crystals were observed in two subjects.

  17. Adaptation Measurement of CAD/CAM Dental Crowns with X-Ray Micro-CT: Metrological Chain Standardization and 3D Gap Size Distribution

    Directory of Open Access Journals (Sweden)

    L. Tapie

    2016-01-01

    Full Text Available Computer-Aided Design and Manufacturing systems are increasingly used to produce dental prostheses, but the parts produced suffer from a lack of evaluation, especially concerning the internal gap of the final assembly, that is, the space between the prepared tooth and the prosthesis. X-ray micro-Computed Tomography (micro-CT is a noninvasive imaging technique enabling the internal inspection of the assembly. It has proved to be an efficient tool for measuring the gap. In this study, a critical review of the protocols using micro-CT to quantify the gap is proposed as an introduction to a new protocol aimed at minimizing errors and enabling comparison between CAD/CAM systems. To compare different systems, a standardized protocol is proposed including two reference geometries. Micro-CT is used to acquire the reference geometries. A new 3D method is then proposed and a new indicator is defined (Gap Size Distribution (GSD. In addition, the usual 2D measurements are described and discussed. The 3D gap measurement method proposed can be used in clinical case geometries and has the considerable advantage of minimizing the data processing steps before performing the measurements.

  18. High energy X-ray diffraction study of a dental ceramics–titanium functional gradient material prepared by field assisted sintering technique

    Energy Technology Data Exchange (ETDEWEB)

    Witte, K., E-mail: kerstin.witte@uni-rostock.de [Institute of Physics, University of Rostock, August-Bebel-Str. 55, 18055 Rostock (Germany); Bodnar, W. [Institute of Physics, University of Rostock, August-Bebel-Str. 55, 18055 Rostock (Germany); Schell, N. [Institute of Materials Research, Helmholtz-Center Geesthacht, Max-Planck-Str. 1, 21502 Geesthacht (Germany); Lang, H. [Department of Operative Dentistry and Periodontology, University of Rostock, Strempelstr. 13, 18057 Rostock (Germany); Burkel, E. [Institute of Physics, University of Rostock, August-Bebel-Str. 55, 18055 Rostock (Germany)

    2014-09-15

    A functional gradient material with eleven layers composed of a dental ceramics and titanium was successfully consolidated using field assisted sintering technique in a two-step sintering process. High energy X-ray diffraction studies on the gradient were performed at High Energy Material Science beamline at Desy in Hamburg. Phase composition, crystal unit edges and lattice mismatch along the gradient were determined applying Rietveld refinement procedure. Phase analysis revealed that the main crystalline phase present in the gradient is α-Ti. Crystallinity increases stepwisely along the gradient with a decreasing increment between every next layer, following rather the weight fraction of titanium. The crystal unit edge a of titanium remains approximately constant with a value of 2.9686(1) Å, while c is reduced with increasing amount of titanium. In the layer with pure titanium the crystal unit edge c is constant with a value of 4.7174(2) Å. The lattice mismatch leading to an internal stress was calculated over the whole gradient. It was found that the maximal internal stress in titanium embedded in the studied gradient is significantly smaller than its yield strength, which implies that the structure of titanium along the whole gradient is mechanically stable. - Highlights: • High energy XRD studies of dental ceramics–Ti gradient material consolidated by FAST. • Phase composition, crystallinity and lattice parameters are determined. • Crystallinity increases stepwisely along the gradient following weight fraction of Ti. • Lattice mismatch leading to internal stress is calculated over the whole gradient. • Internal stress in α-Ti embedded in the gradient is smaller than its yield strength.

  19. Studies of crystalline CdZnTe radiation detectors and polycrystalline thin film CdTe for X-ray imaging applications

    CERN Document Server

    Ede, A

    2001-01-01

    The development of a replacement to the conventional film based X-ray imaging technique is required for many reasons. One possible route for this is the use of a large area film of a suitable semiconductor overlaid on an amorphous silicon readout array. A suitable semiconductor exists in cadmium telluride and its tertiary alloy cadmium zinc telluride. In this thesis the spectroscopic characteristics of commercially available CZT X- and gamma-radiation detectors are established. The electronic, optical, electro-optic, structural and compositional properties of these detectors are then investigated. The attained data is used to infer a greater understanding for the carrier transport in a CZT radiation detector following the interaction of a high energy photon. Following this a method used to fabricate large area films of CdTe on a commercial scale is described. This is cathodic electrodeposition from an aqueous electrolyte. The theory and experimental arrangement for this technique are described in detail with ...

  20. Phase and Texture of Solution-Processed Copper Phthalocyanine Thin Films Investigated by Two-Dimensional Grazing Incidence X-Ray Diffraction

    Directory of Open Access Journals (Sweden)

    Lulu Deng

    2011-07-01

    Full Text Available The phase and texture of a newly developed solution-processed copper phthalocyanine (CuPc thin film have been investigated by two-dimensional grazing incidence X-ray diffraction. The results show that it has β phase crystalline structure, with crystallinity greater than 80%. The average size of the crystallites is found to be about 24 nm. There are two different arrangements of crystallites, with one dominating the diffraction pattern. Both of them have preferred orientation along the thin film normal. Based on the similarities to the vacuum deposited CuPc thin films, the new solution processing method is verified to offer a good alternative to vacuum process, for the fabrication of low cost small molecule based organic photovoltaics.

  1. Close-Spaced Sublimation Growth and Characterization of Polycrystalline Cd1-xZnxTe Thick Films for Flat-Panel X-ray Detectors

    Science.gov (United States)

    Okamoto, Tamotsu; Kono, Makoto; Jibiki, Takayuki; Imai, Kiyokazu; Kishihara, Hiroyuki; Kaino, Masatomo; Tokuda, Satoshi; Sato, Toshiyuki

    2008-04-01

    Polycrystalline Cd1-xZnxTe thick films (x ˜0.05) with thicknesses above 400 µm were prepared by the close-spaced sublimation (CSS) as a conversion layer for next-generation highly efficient flat-panel X-ray detectors. The effects of the substrate temperature on the properties of the Cd1-xZnxTe layer were investigated, and it was found that the surface morphology and preferred crystallographic orientation depended on the substrate temperature. Furthermore, the control of the initial stage of deposition of Cd1-xZnxTe films was attempted, and high-quality Cd1-xZnxTe thick films were obtained by deposition after removing the surface layer of the sintered CdTe and ZnTe powder source.

  2. X-ray diffraction residual stress calculation on textured La 2/3Sr 1/3MnO 3 thin film

    Science.gov (United States)

    Meda, Lamartine; Dahmen, Klaus H.; Hayek, Saleh; Garmestani, Hamid

    2004-03-01

    Residual stresses and texture in La2/3Sr1/3MnO3 (LSMO) thin films have been investigated. The films were deposited on (1 0 0) LaAlO3 (LAO) and (1 0 0) MgO single crystals by liquid delivery-metal organic chemical vapor deposition (LD-MOCVD). X-ray diffraction (XRD) pole figures showed (0 0 1)LSMO//(0 0 1)LAO and (0 0 1)LSMO//(0 0 1)MgO preferred orientation. Residual stresses were calculated using a modified sin2 ψ method, crystallite group method (CGM), assuming a biaxial stress state. Compressive stresses on the order of 224 and 1150 MPa were obtained for LSMO films deposited on LAO (LSMO/LAO) and MgO (LSMO/MgO), respectively.

  3. Identification of pulpitis at dental X-ray periapical radiography based on edge detection, texture description and artificial neural networks

    Directory of Open Access Journals (Sweden)

    Bernard Y Tumbelaka

    2014-01-01

    Full Text Available Objectives: The aim of the present research was to identify pulpitis through periapical radiography by applying edges as basis image features, the texture description and the artificial neural networks (ANNs. Materials and Methods: Input image data records of 10 molar and 10 canine teeth were used. The clinical diagnosis of interest cases were represented as normal pulp, reversible and irreversible pulpitis, and necrotic pulp. The following image processing steps were done. First, the data records were converted digitally and preprocessed as its original image using the Gaussian Filter to obtain the best smoothed intensity distribution. Second, the local image differentiation was used to produce edge detector operators, e(x,y as the image gradient; ∇f(x,y providing useful information about the local intensity variations. Third, these results were analyzed by using the texture descriptors to obtain digitally the image entropy, H. The fourth step, all were characterized by the ANNs. Results: The edge detection carried important information about the object boundaries of pulpal health and pain conditions in the dental pulp significantly. The image entropy which was identified, the diagnostic term, was obtained from texture descriptors in the segmentation regions where the curves of pulp states tent convergence with the normal pulp line from 4.9014 to 4.6843 decreasing to the reversible and the irreversible pulpitis line include the nectrotic pulp line from 4.6812 to 4.5926 and then inputting to the ANNs analysis at the same of mean square error around 0.0003. Conclusions: Referred to these results, the correlation of the image entropy and the ANNs analysis could be linearly classified with the critical point of 4.6827. Finally, it could be concluded that the direct reading radiography is better to be digitized in order to provide us the best choice for diagnosis validation.

  4. 全景X射线牙片机辐射检定和质量控制%Radiation Veriifcation and Quality Control of Dental Panoramic X-Ray Machine

    Institute of Scientific and Technical Information of China (English)

    汪长岭; 汤黎明; 夏勋荣

    2014-01-01

    目的:保证全景X射线牙片机正常工作,并确保其辐射安全性。方法采用比拉那型X射线剂量计对4种全景牙片机辐射输出的空气比释动能率、重复性以及质量进行检测。结果此次检定的全景X射线牙片机基本可较好地达到JJG744-2004《医用诊断X射线辐射源检定规程》的指标要求。结论辐射检定是全景牙片机医学检定的重要组成部分,为制定辐射检定规范提供了参考。%Objective To ensure the normal work and radiation safety of dental panoramic X-ray machine. Methods Air kerma rate, repeatability and quality of radiation output of four kinds of dental panoramic X-ray machines were detected with Piranha X-ray dosimeter.Resulta All the indicators of the four kinds of machines can meet the requirements of JJG744-2004 verification regulation of medical diagnostic X-ray radiation source.Conclusion As an important part of medical veriifcation of dental panoramic X-ray machine, radiation veriifcation can provide reference information for the formulation of radiation veriifcation standard.

  5. Video enhancement of dental radiographic films

    Energy Technology Data Exchange (ETDEWEB)

    Van Dis, M.L.; Beck, F.M.; Miles, D.A. (Ohio State Univ., Columbus (USA))

    1989-08-01

    A prototype video image display system, a real-time analog enhancer (RAE), was compared to conventional viewing conditions with the use of nonscreen dental films. When medium optical density films were evaluated, there was no significant difference in the number of radiographic details detected. Conventional viewing conditions allowed perception of more details when dark films were evaluated; however, the RAE unit allowed the perception of more details when light films were viewed.

  6. X-Ray Polarimetry

    CERN Document Server

    Kaaret, Philip

    2014-01-01

    We review the basic principles of X-ray polarimetry and current detector technologies based on the photoelectric effect, Bragg reflection, and Compton scattering. Recent technological advances in high-spatial-resolution gas-filled X-ray detectors have enabled efficient polarimeters exploiting the photoelectric effect that hold great scientific promise for X-ray polarimetry in the 2-10 keV band. Advances in the fabrication of multilayer optics have made feasible the construction of broad-band soft X-ray polarimeters based on Bragg reflection. Developments in scintillator and solid-state hard X-ray detectors facilitate construction of both modular, large area Compton scattering polarimeters and compact devices suitable for use with focusing X-ray telescopes.

  7. Crystal and electronic structure study of AgAu and AgCu bimetallic alloy thin films by X-ray techniques

    Energy Technology Data Exchange (ETDEWEB)

    Ozkendir, O. Murat, E-mail: ozkendir@gmail.com [Mersin University, Faculty of Technology, Energy Systems Engineering, Tarsus (Turkey); Mersin University, Institute of Natural Science, Department of Nanotechnology and Advanced Materials, Mersin (Turkey); Cengiz, E. [Karadeniz Technical University, Faculty of Science, Department of Physics, Trabzon (Turkey); Yalaz, E. [Mersin University, Institute of Natural Science, Department of Nanotechnology and Advanced Materials, Mersin (Turkey); Söğüt, Ö.; Ayas, D.H. [Kahramanmaraş Sütçü İmam Üniversitesi, Faculty of Science and Letters, Department of Physics, Kahramanmaraş (Turkey); Thammajak, B. Nirawat [Synchrotron Light Research Institute (Public Organisation), 111 University Avenue, T. Suranaree, A. Muang, Nakhon Ratchasima 30000 (Thailand)

    2016-05-15

    Highlights: • Crystal and electronic properties of bimetallic AgCu and AgAu alloy thin films were studied. • Both AgCu and AgAu bimetallic samples were determined to have cubic crystal geometry. • Strong influence of Cu and Au atoms on the electronic structure of the Ag atoms were determined. - Abstract: Crystal and electronic structure properties of bimetallic AgAu and AgCu alloy thin films were investigated by X-ray spectroscopic techniques. The aim of this study is to probe the influence of Au or Cu atoms on the electronic behaviors of Ag ions in bimetallic alloy materials that yields different crystal properties. To identify the mechanisms causing crystal phase transitions, study were supported by the collected EXAFS (Extended X-ray Absorption Fine Structure) data. Crystal structures of both Cu and Au doped bimetallic Ag samples were determined mainly in cubic geometry with “Fm3m” space group. Through the Ag–Au and Ag–Cu molecular interactions during bimetallic alloy formations, highly overlapped electronic levels that supports large molecular band formations were observed with different ionization states. Besides, traces of the d–d interactions in Au rich samples were determined as the main interplay in the broad molecular bond formations. The exact atomic locations and types in the samples were determined by EXAFS studies and supported by the performed calculations with FEFF scientific code.

  8. Investigation of a metal-ionic conductor interface in thin film samples using X-ray photoelectron spectroscopy and electrical measurements

    Energy Technology Data Exchange (ETDEWEB)

    Couturier, G.; Danto, Y.; Barriere, A.S.; Duc, T.M.; Garaud, Y.

    1982-03-26

    The surface of an evaporated thin film of the ionic conductor ..beta..-PbF/sub 2/ was analysed using X-ray photoelectron spectroscopy (XPS). The results were compared with those obtained from nuclear and secondary ion mass spectrometry measurements. An analysis of the Au-..beta..-PbF/sub 2/ interface shows the presence of a thin layer of partly oxidized metallic lead. Part of this interfacial lead diffused across the gold film towards the external surface where it became bound to oxygen. An electrical analysis of the interface was performed by studying the capacitance as a function of the surface potential. The differences between experimental and calculated values are discussed in the light of the XPS measurements.

  9. Ga+ ion irradiation-induced changes in magnetic anisotropy of a Pt/Co/Pt thin film studied by X-ray magnetic circular dichroism

    Directory of Open Access Journals (Sweden)

    Liedke M. O.

    2013-01-01

    Full Text Available Ga+ ion irradiation-induced changes in magnetic anisotropy of a Pt/Co/Pt ultrathin film are investigated by means of the X-ray magnetic circular dichroism (XMCD technique. A large difference in the Co orbital moment is observed between out-of-plane and in-plane directions of the film at moderate Ga+ fluences of ~1-2×1014 ions/cm2, which corresponds to the perpendicular magnetic anisotropy (PMA, while further increased fluences reduce the orbital moment difference, resulting in in-plane magnetization. In contrast, at much higher Ga+ fluences of ~5×1015 ions/cm2, at which PMA is observed again, no significant difference is found in the orbital moment of Co between out-of-plane and in-plane directions. Different origins are thus suggested for the appearance of PMA induced by the irradiation between moderate and high Ga+ fluences.

  10. Large anisotropic Fe orbital moments in perpendicularly magnetized Co2FeAl Heusler alloy thin films revealed by angular-dependent x-ray magnetic circular dichroism

    Science.gov (United States)

    Okabayashi, Jun; Sukegawa, Hiroaki; Wen, Zhenchao; Inomata, Koichiro; Mitani, Seiji

    2013-09-01

    Perpendicular magnetic anisotropy (PMA) in Heusler alloy Co2FeAl thin films sharing an interface with a MgO layer is investigated by angular-dependent x-ray magnetic circular dichroism. Orbital and spin magnetic moments are deduced separately for Fe and Co 3d electrons. In addition, the PMA energies are estimated using the orbital magnetic moments parallel and perpendicular to the film surfaces. We found that PMA in Co2FeAl is determined mainly by the contribution of Fe atoms with large orbital magnetic moments, which are enhanced at the interface between Co2FeAl and MgO. Furthermore, element specific magnetization curves of Fe and Co are found to be similar, suggesting the existence of ferromagnetic coupling between Fe and Co PMA directions.

  11. Determination of the surface band bending in InxGa1−xN films by hard x-ray photoemission spectroscopy

    Directory of Open Access Journals (Sweden)

    Mickael Lozac'h, Shigenori Ueda, Shitao Liu, Hideki Yoshikawa, Sang Liwen, Xinqiang Wang, Bo Shen, Kazuaki Sakoda, Keisuke Kobayashi and Masatomo Sumiya

    2013-01-01

    Full Text Available Core-level and valence band spectra of InxGa1−xN films were measured using hard x-ray photoemission spectroscopy (HX-PES. Fine structure, caused by the coupling of the localized Ga 3d and In 4d with N 2s states, was experimentally observed in the films. Because of the large detection depth of HX-PES (~20 nm, the spectra contain both surface and bulk information due to the surface band bending. The InxGa1−xN films (x = 0–0.21 exhibited upward surface band bending, and the valence band maximum was shifted to lower binding energy when the mole fraction of InN was increased. On the other hand, downward surface band bending was confirmed for an InN film with low carrier density despite its n-type conduction. Although the Fermi level (EF near the surface of the InN film was detected inside the conduction band as reported previously, it can be concluded that EF in the bulk of the film must be located in the band gap below the conduction band minimum.

  12. Near edge X-ray absorption fine structure study for optimization of hard diamond-like carbon film formation with Ar cluster ion beam

    CERN Document Server

    Kitagawa, T; Kanda, K; Shimizugawa, Y; Toyoda, N; Matsui, S; Yamada, I; Tsubakino, H; Matsuo, J

    2003-01-01

    Diamond-like carbon (DLC) film deposited using C sub 6 sub 0 vapor with simultaneous irradiation of an Ar cluster ion beam was characterized by a near edge X-ray absorption fine structure (NEXAFS), in order to optimize the hard DLC film deposition conditions. Contents of sp sup 2 orbitals in the films, which were estimated from NEXAFS spectra, are 30% lower than that of a conventional DLC film deposited by a RF plasma method. Those contents were obtained under the flux ratio of the C sub 6 sub 0 molecules to the Ar cluster ions to range from 1 to 20, at 5keV of Ar cluster ion acceleration energy. Average hardness of the films was 50 GPa under these flux ratios. This hardness was three times higher than that of a conventional DLC film. Furthermore, the lowest sp sup 2 content and above-mentioned high hardness were obtained at room temperature of the substrate when the depositions were performed in the range of the substrate temperature from room temperature to 250degC. (author)

  13. In-situ X-ray diffraction studies of time and thickness dependence of crystallization of amorphous TiO{sub 2} thin films and stress evolution

    Energy Technology Data Exchange (ETDEWEB)

    Kuzel, R., E-mail: kuzel@karlov.mff.cuni.c [Department of Condensed Matter Physics, Faculty of Mathematics and Physics, Charles University in Prague, 121 16 Praha 2 (Czech Republic); Nichtova, L.; Matej, Z. [Department of Condensed Matter Physics, Faculty of Mathematics and Physics, Charles University in Prague, 121 16 Praha 2 (Czech Republic); Musil, J. [Department of Physics, Faculty of Applied Sciences, University of West Bohemia in Pilsen, Pilsen (Czech Republic)

    2010-12-30

    Remarkable properties of titanium dioxide films such as hydrophilicity or photocatalytic activity depend largely on their phase composition, microstructure and in particular on the crystallinity. By in-situ X-ray diffraction studies of isochronal and isothermal annealing of amorphous films with different thickness at different temperatures it was found that the crystallization process can be quite well described by the Johnson-Mehl-Avrami-Kolmogorov formula modified by the introduction of crystallization onset. This and other parameters of the formula strongly depend on the film thickness. For thickness below about 500 nm the crystallization is very slow. Simultaneously, the appearance and increase of tensile stresses with the annealing time were observed and these stresses were confirmed by detailed studies by both total pattern fitting and sin{sup 2{psi}} method on post-annealed samples. The stresses rapidly increase with decreasing thickness of the films. It seems that there is a strong correlation between the stresses and crystallization onset and/or crystallization rate. Tensile stresses that are generated during crystallization further inhibit crystallization and cause significant thickness dependence of the crystallization. The temperature and time dependence of microstructure of crystallized amorphous films differ significantly from those obtained for as-deposited nanocrystalline films or nanocrystalline powders. During annealing, quite large crystallites are formed quickly with the preferred orientation (001) that is suppressed with the proceeding time.

  14. Near-Edge X-Ray Absorption Fine Structure of Ultrananocrystalline Diamond/Hydrogenated Amorphous Carbon Films Prepared by Pulsed Laser Deposition

    Directory of Open Access Journals (Sweden)

    Shinya Ohmagari

    2009-01-01

    Full Text Available The atomic bonding configuration of ultrananocrystalline diamond (UNCD/hydrogenated amorphous carbon (a-C:H films prepared by pulsed laser ablation of graphite in a hydrogen atmosphere was examined by near-edge X-ray absorption fine structure spectroscopy. The measured spectra were decomposed with simple component spectra, and they were analyzed in detail. As compared to the a-C:H films deposited at room substrate-temperature, the UNCD/a-C:H and nonhydrogenated amorphous carbon (a-C films deposited at a substrate-temperature of 550∘C exhibited enhanced ∗ and ∗C≡C peaks. At the elevated substrate-temperature, the ∗ and ∗C≡C bonds formation is enhanced while the ∗C–H and ∗C–C bonds formation is suppressed. The UNCD/a-C:H film showed a larger ∗C–C peak than the a-C film deposited at the same elevated substrate-temperature in vacuum. We believe that the intense ∗C–C peak is evidently responsible for UNCD crystallites existence in the film.

  15. Electronic structure of Al-doped ZnO transparent conductive thin films studied by x-ray absorption and emission spectroscopies

    Energy Technology Data Exchange (ETDEWEB)

    Huang, W. H.; Sun, S. J.; Chiou, J. W. [Department of Applied Physics, National University of Kaohsiung, Kaohsiung 811, Taiwan (China); Chou, H. [Department of Physics, National Sun Yat-sen University, Kaohsiung 804, Taiwan (China); Chan, T. S.; Lin, H.-J. [National Synchrotron Radiation Research Center, Hsinchu 300, Taiwan (China); Kumar, Krishna [Department of Electrical and Computer Engineering, University of Waterloo, Ontario N2L 3G1 (Canada); Guo, J.-H. [Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States)

    2011-11-15

    This study used O K-, Zn L{sub 3}-, Zn K-, and Al K-edges x-ray absorption near-edge structure (XANES) and O K-edge x-ray emission spectroscopy (XES) measurements to investigate the electronic structure of transparent Al-doped ZnO (AZO) thin film conductors. The samples were prepared on glass substrates at a low temperature near 77 K by using a standard RF sputtering method. High-purity Ne (5N) was used as the sputtering gas. The crystallography of AZO thin films gradually transformed from the ZnO wurtize structure to an amorphous structure during sample deposition, which suggests the suitability to grow on flexible substrates, eliminating the severe degradation due to fragmentation by repeated bending. The O K- and Zn L{sub 3}-edges XANES spectra of AZO thin films revealed a decrease in the number of both O 2p and Zn 3d unoccupied states when the pressure of Ne was increased from 5 to 100 mTorr. In contrast, Al K-edges XANES spectra showed that the number of unoccupied states of Al 3p increased in conjunction with the pressure of Ne, indicating an electron transfer from Al to O atoms, and suggesting that Al doping increases the negative effective charge of oxygen ions. XES and XANES spectra of O 2p states at the O K-edge also revealed that Al doping not only raised the conduction-band-minimum, but also increased the valence-band-maximum and the band-gap. The results indicate that the reduction in conductivity of AZO thin films is due to the generation of ionic characters, the increase in band-gap, and the decrease in density of unoccupied states of oxygen.

  16. Microscopic study of dental hard tissues in primary teeth with Dentinogenesis Imperfecta Type II: Correlation of 3D imaging using X-ray microtomography and polarising microscopy.

    Science.gov (United States)

    Davis, Graham R; Fearne, Janice M; Sabel, Nina; Norén, Jörgen G

    2015-07-01

    The aim of this study was to examine the histological appearance of dental hard tissues in primary teeth from children with DI using conventional polarised light microscopy and correlate that with 3D imaging using X-ray microtomograpy (XMT) to gain a further understanding of the dentine structure of teeth diagnosed with dentinogenesis imperfecta. Undecalcified sections of primary teeth from patients diagnosed with Dentinogenesis Imperfecta Type II were examined using polarised light microscopy. XMT was employed for 3D-imaging and analysis of the dentine. The polarised light microscopy and XMT revealed tubular structures in the dentine seen as vacuoles coinciding with the path of normal dentinal tubules but not continuous tubules. The size of the tubules was close to that of capillaries. The largest tubular structures had a direction corresponding to where the pulp tissue would have been located during primary dentine formation. The dysfunctional mineralisation of the dentine and obliteration of the pulp evidently leaves blood vessels in the dentine which have in the main been tied off and, in the undecalcified sections, appear as vacuoles. Although from radiographs, the pulp in teeth affected by Dentinogenesis Imperfect type II appears to be completely obliterated, a network of interconnected vessels may remain. The presence of large dentinal tubules and blood vessels, or the remnants of blood vessels, could provide a pathway for bacteria from the oral cavity. This might account for why some of these teeth develop periapical abscesses in spite of apparently having no pulp. Copyright © 2015 Elsevier Ltd. All rights reserved.

  17. X-Ray

    Science.gov (United States)

    ... You may be allowed to remain with your child during the test. If you remain in the room during the X-ray exposure, you'll likely be asked to wear a lead apron to shield you from unnecessary exposure. After the X-ray ...

  18. X-Ray Surveys

    CERN Document Server

    Giommi, P; Perri, M

    1998-01-01

    A review of recent developments in the field of X-ray surveys, especially in the hard (2-10 and 5-10 keV) bands, is given. A new detailed comparison between the measurements in the hard band and extrapolations from ROSAT counts, that takes into proper account the observed distribution of spectral slopes, is presented. Direct comparisons between deep ROSAT and BeppoSAX images show that most hard X-ray sources are also detected at soft X-ray energies. This may indicate that heavily cutoff sources, that should not be detectable in the ROSAT band but are expected in large numbers from unified AGN schemes, are in fact detected because of the emerging of either non-nuclear components, or of reflected, or partially transmitted nuclear X-rays. These soft components may complicate the estimation of the soft X-ray luminosity function and cosmological evolution of AGN.

  19. X-ray Polarimetry

    Science.gov (United States)

    Kallman, T.

    In spite of the recent advances in X-ray instrumentation, polarimetry remains an area which has been virtually unexplored in the last 20 years. The scientific motivation to study polarization has increased during this time: emission models designed to repro- duce X-ray spectra can be tested using polarization, and polarization detected in other wavelength bands makes clear predictions as to the X-ray polarization. Polarization remains the only way to infer geometrical properties of sources which are too small to be spatially resolved. At the same time, there has been recent progress in instrumen- tation which is likely to allow searches for X-ray polarization at levels significantly below what was possible for early detectors. In this talk I will review the history of X-ray polarimetry, discuss some experimental techniques and the scientific problems which can be addressed by future experiments.

  20. Cation profiling of passive films on stainless steel formed in sulphuric and acetic acid by deconvolution of angle-resolved X-ray photoelectron spectra

    Energy Technology Data Exchange (ETDEWEB)

    Högström, Jonas, E-mail: jhogstrom@gmail.com; Fredriksson, Wendy, E-mail: wendy.fredriksson@kemi.uu.se; Edstrom, Kristina, E-mail: kristina.edstrom@kemi.uu.se; Björefors, Fredrik, E-mail: fredrik.bjorefors@kemi.uu.se; Nyholm, Leif, E-mail: leif.nyholm@kemi.uu.se; Olsson, Claes-Olof A., E-mail: drclabbe@kth.se

    2013-11-01

    An approach for determining depth gradients of metal-ion concentrations in passive films on stainless steel using angle-resolved X-ray photoelectron spectroscopy (ARXPS) is described. The iterative method, which is based on analyses of the oxidised metal peaks, provides increased precision and hence allows faster ARXPS measurements to be carried out. The method was used to determine the concentration depth profiles for molybdenum, iron and chromium in passive films on 316L/EN 1.4432 stainless steel samples oxidised in 0.5 M H{sub 2}SO{sub 4} and acetic acid diluted with 0.02 M Na{sub 2}B{sub 4}O{sub 7} · 10H{sub 2}O and 1 M H{sub 2}O, respectively. The molybdenum concentration in the film is pin-pointed to the oxide/metal interface and the films also contained an iron-ion-enriched surface layer and a chromium-ion-dominated middle layer. Although films of similar composition and thickness (i.e., about 2 nm) were formed in the two electrolytes, the corrosion currents were found to be three orders of magnitude larger in the acetic acid solution. The differences in the layer composition, found for the two electrolytes as well as different oxidation conditions, can be explained based on the oxidation potentials of the metals and the dissolution rates of the different metal ions.

  1. X-ray characterization of CdO thin films grown on a-, c-, r- and m-plane sapphire by metalorganic vapour phase-epitaxy

    Energy Technology Data Exchange (ETDEWEB)

    Zuniga-Perez, J.; Martinez-Tomas, C.; Munoz-Sanjose, V. [Departamento de Fisica Aplicada y Electromagnetismo, Universitat de Valencia, C/Dr. Moliner 50, 46100 Burjassot (Spain)

    2005-02-01

    CdO thin films have been grown on a-plane (11 anti 20), c-plane (0001), r-plane (01 anti 12) and m-plane (10 anti 10) sapphire substrates by metalorganic vapour-phase epitaxy (MOVPE). The effects of different substrate orientations on the structural properties of the films have been analyzed by means of X-ray diffraction, including {theta}-2{theta} scans, pole figures and rocking curves. (111), (001) and (110) orientations are found on a-, r-, and m-sapphire respectively, while films deposited on c-plane exhibit an orientation in which no low-index crystal plane is parallel to the sample surface. The recorded pole figures have allowed determining the epitaxial relationships between films and substrates, as well as the presence or absence of extended defects. The rocking curves indicate that high quality thin films, in terms of tilt and twist, can be obtained on r-, c- and m-plane sapphire, while further improvement is needed over the a-orientation. (copyright 2005 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim) (orig.)

  2. Structure and Bonding in Amorphous Cr1-xCx Nanocomposite Thin Films: X-ray Absorption Spectra and First-Principles Calculation

    CERN Document Server

    Olovsson, Weine; Magnuson, Martin

    2016-01-01

    The local structure and chemical bonding in two-phase amorphous Cr$_{1-x}$C$_{x}$ nanocomposite thin films are investigated by Cr $K$-edge ($1s$) X-ray absorption near-edge structure (XANES) and extended X-ray absorption fine structure (EXAFS) spectroscopies in comparison to theory. By utilizing the computationally efficient \\textit{stochastic quenching} (SQ) technique, we reveal the complexity of different Cr-sites in the transition metal carbides, highlighting the need for large scale averaging to obtain theoretical XANES and EXAFS spectra for comparison with measurements. As shown in this work, it is advantageous to use \\textit{ab initio} theory as an assessment to correctly model and fit experimental spectra and investigate the trends of bond lengths and coordination numbers in complex amorphous materials. With sufficient total carbon content ($\\geq$ 30 at\\%), we find that the short-range coordination in the amorphous carbide phase exhibit similarities to that of a Cr$_{7}$C$_{3\\pm{}y}$ structure, while e...

  3. Local structure of Fe-doped In{sub 2}O{sub 3} films investigated by X-ray absorption fine structure spectroscopy

    Energy Technology Data Exchange (ETDEWEB)

    An, Yukai; Wang, Shiqi; Feng, Deqiang; Liu, Jiwen [Key Laboratory of Display Materials and Photoelectric Devices, Ministry of Education, Tianjin (China); Tianjin Key Laboratory for Photoelectric Materials and Devices, Tianjin (China); Tianjin University of Technology, School of Material Science and Engineering, Tianjin (China); Wu, Zhonghua [Chinese Academy of Sciences, Beijing Synchrotron Radiation Facility (BSRF), Institute of High Energy Physics, Beijing (China)

    2014-06-15

    (In{sub 1-x}Fe{sub x}){sub 2}O{sub 3} (x = 0.07, 0.09, 0.16, 0.22, 0.31) films were deposited on Si(100) substrates by RF-magnetron sputtering technique. The influence of Fe doping on the local structure of films was investigated by X-ray absorption spectroscopy (XAS) at Fe K-edge and L-edge. For the (In{sub 1-x}Fe{sub x}){sub 2}O{sub 3} films with x = 0.07, 0.09 and 0.16, Fe ions dissolve into In{sub 2}O{sub 3} and substitute for In{sup 3+} sites with a mixed-valence state (Fe{sup 2+}/Fe{sup 3+}) of Fe ions. However, a secondary phase of Fe metal clusters is formed in the (In{sub 1-x}Fe{sub x}){sub 2}O{sub 3} films with x = 0.22 and 0.31. The qualitative analyses of Fe-K edge extended X-ray absorption fine structure (EXAFS) reveal that the Fe-O bond length shortens and the corresponding Debye-Waller factor (α{sup 2}) increases with the increase of Fe concentration, indicating the relaxation of oxygen environment of Fe ions upon substitution. The anomalously large structural disorder and very short Fe-O distance are also observed in the films with high Fe concentration. Linear combination fittings at Fe L-edge further confirm the coexistence of Fe{sup 2+} and Fe{sup 3+} with a ratio of ∝3:2 (Fe{sup 2+}: Fe{sup 3+}) for the (In{sub 1-x}Fe{sub x}){sub 2}O{sub 3} film with x = 0.16. However, a significant fraction (∝40 at%) of the Fe metal clusters is found in the (In{sub 1-x}Fe{sub x}){sub 2}O{sub 3} film with x = 0.31. (orig.)

  4. Perspectives of medical X-ray imaging

    Energy Technology Data Exchange (ETDEWEB)

    Freudenberger, J. E-mail: joerg.freudenberger@med.siemens.de; Hell, E.; Knuepfer, W

    2001-06-21

    While X-ray image intensifiers (XII), storage phosphor screens and film-screen systems are still the work horses of medical imaging, large flat panel solid state detectors using either scintillators and amorphous silicon photo diode arrays (FD-Si), or direct X-ray conversion in amorphous selenium are reaching maturity. The main advantage with respect to image quality and low patient dose of the XII and FD-Si systems is caused by the rise of the Detector Quantum Efficiency originating from the application of thick needle-structured phosphor X-ray absorbers. With the detectors getting closer to an optimal state, further progress in medical X-ray imaging requires an improvement of the usable source characteristics. The development of clinical monochromatic X-ray sources of high power would not only allow an improved contrast-to-dose ratio by allowing smaller average photon energies in applications but would also lead to new imaging techniques.

  5. Perspectives of medical X-ray imaging

    Science.gov (United States)

    Freudenberger, J.; Hell, E.; Knüpfer, W.

    2001-06-01

    While X-ray image intensifiers (XII), storage phosphor screens and film-screen systems are still the work horses of medical imaging, large flat panel solid state detectors using either scintillators and amorphous silicon photo diode arrays (FD-Si), or direct X-ray conversion in amorphous selenium are reaching maturity. The main advantage with respect to image quality and low patient dose of the XII and FD-Si systems is caused by the rise of the Detector Quantum Efficiency originating from the application of thick needle-structured phosphor X-ray absorbers. With the detectors getting closer to an optimal state, further progress in medical X-ray imaging requires an improvement of the usable source characteristics. The development of clinical monochromatic X-ray sources of high power would not only allow an improved contrast-to-dose ratio by allowing smaller average photon energies in applications but would also lead to new imaging techniques.

  6. Amorphous In–Ga–Zn–O thin-film transistor active pixel sensor x-ray imager for digital breast tomosynthesis

    Energy Technology Data Exchange (ETDEWEB)

    Zhao, Chumin; Kanicki, Jerzy, E-mail: kanicki@eecs.umich.edu [Solid-State Electronic Laboratory, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, Michigan 48109 (United States)

    2014-09-15

    Purpose: The breast cancer detection rate for digital breast tomosynthesis (DBT) is limited by the x-ray image quality. The limiting Nyquist frequency for current DBT systems is around 5 lp/mm, while the fine image details contained in the high spatial frequency region (>5 lp/mm) are lost. Also today the tomosynthesis patient dose is high (0.67–3.52 mGy). To address current issues, in this paper, for the first time, a high-resolution low-dose organic photodetector/amorphous In–Ga–Zn–O thin-film transistor (a-IGZO TFT) active pixel sensor (APS) x-ray imager is proposed for next generation DBT systems. Methods: The indirect x-ray detector is based on a combination of a novel low-cost organic photodiode (OPD) and a cesium iodide-based (CsI:Tl) scintillator. The proposed APS x-ray imager overcomes the difficulty of weak signal detection, when small pixel size and low exposure conditions are used, by an on-pixel signal amplification with a significant charge gain. The electrical performance of a-IGZO TFT APS pixel circuit is investigated by SPICE simulation using modified Rensselaer Polytechnic Institute amorphous silicon (a-Si:H) TFT model. Finally, the noise, detective quantum efficiency (DQE), and resolvability of the complete system are modeled using the cascaded system formalism. Results: The result demonstrates that a large charge gain of 31–122 is achieved for the proposed high-mobility (5–20 cm{sup 2}/V s) amorphous metal-oxide TFT APS. The charge gain is sufficient to eliminate the TFT thermal noise, flicker noise as well as the external readout circuit noise. Moreover, the low TFT (<10{sup −13} A) and OPD (<10{sup −8} A/cm{sup 2}) leakage currents can further reduce the APS noise. Cascaded system analysis shows that the proposed APS imager with a 75 μm pixel pitch can effectively resolve the Nyquist frequency of 6.67 lp/mm, which can be further improved to ∼10 lp/mm if the pixel pitch is reduced to 50 μm. Moreover, the

  7. Justification and good practice in using handheld portable dental X-ray equipment: a position paper prepared by the European Academy of DentoMaxilloFacial Radiology (EADMFR)

    OpenAIRE

    Berkhout, W E R; Suomalainen, A.; Brüllmann, D; Jacobs, R.; Horner, K; Stamatakis, H. C.

    2015-01-01

    Handheld portable X-ray devices are increasingly used for intraoral radiography. This development introduces new challenges to staff and patient safety, for which new or revised risk assessments must be made and acted upon prior to use. Major issues might be: difficulties in using rectangular collimation with beam aiming devices, more complex matching of exposure settings to the X-ray receptor used (e.g. longer exposure times), movements owing to the units' weight, protection of the operator ...

  8. Justification and good practice in using handheld portable dental X-ray equipment: a position paper prepared by the European Academy of DentoMaxilloFacial Radiology (EADMFR).

    Science.gov (United States)

    Berkhout, W E R; Suomalainen, A; Brüllmann, D; Jacobs, R; Horner, K; Stamatakis, H C

    2015-01-01

    Handheld portable X-ray devices are increasingly used for intraoral radiography. This development introduces new challenges to staff and patient safety, for which new or revised risk assessments must be made and acted upon prior to use. Major issues might be: difficulties in using rectangular collimation with beam aiming devices, more complex matching of exposure settings to the X-ray receptor used (e.g. longer exposure times), movements owing to the units' weight, protection of the operator and third persons, and the use in uncontrolled environments. These problems may result in violation of the "as low as reasonably achievable'', that is, ALARA principle by an increase in (re)exposures compared with the other available intraoral X-ray devices. Hence, the use of handheld portable X-ray devices should be considered only after careful and documented evaluation (which might be performed based on medical physics support), when there is evidence that handheld operation has benefits over traditional modalities and when no new risks to the operators and/or third parties are caused. It is expected that the use of handheld portable X-ray devices will be very exceptional, and for justified situations only. Special attention should be drawn to beam-aiming devices, rectangular collimation, the section of the X-ray receptor, focus-skin distance, and backscatter shielding, and that the unit delivers reproducible dose over the full set of environmental conditions (e.g. battery status and temperature).

  9. X-ray lasers

    CERN Document Server

    Elton, Raymond C

    2012-01-01

    The first in its field, this book is both an introduction to x-ray lasers and a how-to guide for specialists. It provides new entrants and others interested in the field with a comprehensive overview and describes useful examples of analysis and experiments as background and guidance for researchers undertaking new laser designs. In one succinct volume, X-Ray Lasers collects the knowledge and experience gained in two decades of x-ray laser development and conveys the exciting challenges and possibilities still to come._Add on for longer version of blurb_M>The reader is first introduced

  10. Bone X-Ray (Radiography)

    Medline Plus

    Full Text Available ... Resources Professions Site Index A-Z X-ray (Radiography) - Bone Bone x-ray uses a very small ... X-ray (Radiography)? What is Bone X-ray (Radiography)? An x-ray (radiograph) is a noninvasive medical ...

  11. LuAG:Pr, LuAG:La, and LuAP:Ce thin film scintillators for visualisation of x-ray images

    Science.gov (United States)

    Zorenko, Yuriy; Gorbenko, Vitaliy; Voznyak, Taras; Martin, Thierry; Douissard, Paul-Antoine; Mares, Jiri A.; Nikl, Martin

    2009-05-01

    The work is dedicated to investigation of the luminescent properties of UV-emitting single crystalline films (SCF) based on the Lu3Al5O12:La and Lu3Al5O12:Pr garnet and LuAlO3:Ce perovskite compounds grown by liquid phase epitaxy method from the PbO-B2O3 flux onto Y3Al5O12 and YAlO3 substrates, respectively, for testing as scintillation screens in high-resolution microimaging detectors used in applications with synchrotrons radiation. The first image with a spatial resolution of about 1.5 μm of X-ray excited resolution target was obtained using only the UV part of the light of the LuAG:La SCF scintillators. The possible ways for improvement of figure-of-merit of UV emitting SCF scintillators and increase of spatial resolution of the detector are discussed.

  12. Band offsets of Er{sub 2}O{sub 3} films grown on Ge substrates by X-ray photoelectron spectroscopy

    Energy Technology Data Exchange (ETDEWEB)

    Ji, Ting; Peng, Lining; Cui, Yanxia; Hao, Yuying [Taiyuan University of Technology, Key Laboratory of Advanced Transducers and Intelligent Control System (Ministry of Education), College of Physics and Optoelectronics, Taiyuan (China); Fang, Zebo [Shaoxing University, Department of Physics, Shaoxing (China)

    2014-06-15

    The band alignments of high-k Er{sub 2}O{sub 3} films grown on Ge substrates by molecular beam epitaxy are determined by X-ray photoelectron spectroscopy. The valenceband and the conduction-band offsets of Er{sub 2}O{sub 3} to Ge are found to be 3.16 ± 0.02 and 2.13 ± 0.02 eV, respectively. The energy gap of Er{sub 2}O{sub 3} is 5.96 ± 0.02 eV as determined by the optical spectrophotometry. From the band offset viewpoint, the above results indicate that Er{sub 2}O{sub 3} could be a promising candidate for high-k gate dielectrics on Ge substrate. (orig.)

  13. Mapping the structural order of laser-induced periodic surface structures in thin polymer films by microfocus beam grazing incidence small-angle X-ray scattering.

    Science.gov (United States)

    Martín-Fabiani, Ignacio; Rebollar, Esther; García-Gutiérrez, Mari Cruz; Rueda, Daniel R; Castillejo, Marta; Ezquerra, Tiberio A

    2015-02-11

    In this work we present an accurate mapping of the structural order of laser-induced periodic surface structures (LIPSS) in spin-coated thin polymer films, via a microfocus beam grazing incidence small-angle X-ray scattering (μGISAXS) scan, GISAXS modeling, and atomic force microscopy imaging all along the scanned area. This combined study has allowed the evaluation of the effects on LIPSS formation due to nonhomogeneous spatial distribution of the laser pulse energy, mapping with micrometric resolution the evolution of the period and degree of structural order of LIPSS across the laser beam diameter in a direction perpendicular to the polarization vector. The experiments presented go one step further toward controlling nanostructure formation in LIPSS through a deep understanding of the parameters that influence this process.

  14. Design and image-quality performance of high resolution CMOS-based X-ray imaging detectors for digital mammography

    Science.gov (United States)

    Cha, B. K.; Kim, J. Y.; Kim, Y. J.; Yun, S.; Cho, G.; Kim, H. K.; Seo, C.-W.; Jeon, S.; Huh, Y.

    2012-04-01

    In digital X-ray imaging systems, X-ray imaging detectors based on scintillating screens with electronic devices such as charge-coupled devices (CCDs), thin-film transistors (TFT), complementary metal oxide semiconductor (CMOS) flat panel imagers have been introduced for general radiography, dental, mammography and non-destructive testing (NDT) applications. Recently, a large-area CMOS active-pixel sensor (APS) in combination with scintillation films has been widely used in a variety of digital X-ray imaging applications. We employed a scintillator-based CMOS APS image sensor for high-resolution mammography. In this work, both powder-type Gd2O2S:Tb and a columnar structured CsI:Tl scintillation screens with various thicknesses were fabricated and used as materials to convert X-ray into visible light. These scintillating screens were directly coupled to a CMOS flat panel imager with a 25 × 50 mm2 active area and a 48 μm pixel pitch for high spatial resolution acquisition. We used a W/Al mammographic X-ray source with a 30 kVp energy condition. The imaging characterization of the X-ray detector was measured and analyzed in terms of linearity in incident X-ray dose, modulation transfer function (MTF), noise-power spectrum (NPS) and detective quantum efficiency (DQE).

  15. Friction behaviour of TiAlN films around cubic/hexagonal transition: A 2D grazing incidence X-ray diffraction and electron energy loss spectroscopy study

    Energy Technology Data Exchange (ETDEWEB)

    Pinot, Y. [Université de Haute Alsace, Laboratoire Physique et Mécanique Textiles (EA 4365), F-68093 Mulhouse (France); Pac, M.-J., E-mail: marie-jose.pac@uha.fr [Université de Haute Alsace, Laboratoire Physique et Mécanique Textiles (EA 4365), F-68093 Mulhouse (France); Henry, P. [Université de Haute Alsace, Laboratoire Physique et Mécanique Textiles (EA 4365), F-68093 Mulhouse (France); Rousselot, C. [Université de Franche-Comté, FEMTO-ST (UMR CNRS 6174), F-25211 Montbéliard (France); Odarchenko, Ya.I.; Ivanov, D.A. [Université de Haute Alsace, Institut de Science des Matériaux de Mulhouse (UMR 7361 CNRS), F-68093 Mulhouse (France); Ulhaq-Bouillet, C.; Ersen, O. [Université de Strasbourg, Institut de Physique et Chimie des Matériaux de Strasbourg (UMR CNRS 7504), F-67087 Strasbourg (France); Tuilier, M.-H. [Université de Haute Alsace, Laboratoire Physique et Mécanique Textiles (EA 4365), F-68093 Mulhouse (France)

    2015-02-27

    The properties at different scales of Ti{sub 1−x}Al{sub x}N films deposited by reactive magnetron sputtering from TiAl sintered (S) targets produced by powder metallurgy are compared with those of a set of films previously deposited in the same conditions from mosaic targets (M) made of pure Ti and Al metals. For compositions close to the hcp/fcc transition (around x = 0.6), the friction behaviour, growth directions and organization of crystallized domains are found to be sensitive to the type of target used. The resistance to crack creation is higher for Ti{sub 0.54}Al{sub 0.46}N (S) and Ti{sub 0.38}Al{sub 0.62}N (S) than for Ti{sub 0.50}Al{sub 0.50}N (M) and Ti{sub 0.32}Al{sub 0.68}N (M). From the measurement of mechanical properties, toughness, and wear volumes and from the observation of wear tracks, it is found that films prepared from sintered targets exhibit a better wear resistance. Grazing incidence X-ray diffraction and electron energy loss spectroscopy in Transmission Electronic Microscopy are used to investigate the long- and short-range orders within the films. The morphology of Ti{sub 0.54}Al{sub 0.46}N (S) film can be considered as an array of crystalline domains having reciprocal-space vectors 111 and 200 directed along the meridian but with random in-plane orientation. Ti{sub 0.38}Al{sub 0.62}N (S) Al-rich film presents a random orientation of the crystalline domains whereas Ti{sub 0.32}Al{sub 0.68}N (M) deposited from composite targets exhibits a well-oriented fibrillar structure. The N K-edge Electron Energy Loss Near Edge Spectra are discussed with previous results of Extended X-ray Absorption Fine Structure Spectroscopy, which has evidenced different values of Al–N and Ti–N bond lengths, either octahedral (cubic-like) or tetrahedral (hexagonal-like) within Ti{sub 0.50}Al{sub 0.50}N (M) and Ti{sub 0.32}Al{sub 0.68}N (M) films. For similar compositions, films deposited from sintered alloys contain more nitrogen atoms in octahedral cubic

  16. Bone x-ray

    Science.gov (United States)

    ... or broken bone Bone tumors Degenerative bone conditions Osteomyelitis (inflammation of the bone caused by an infection) ... Multiple myeloma Osgood-Schlatter disease Osteogenesis imperfecta Osteomalacia Osteomyelitis Paget disease of the bone Rickets X-ray ...

  17. Hand x-ray

    Science.gov (United States)

    ... include fractures, bone tumors , degenerative bone conditions, and osteomyelitis (inflammation of the bone caused by an infection). ... chap 46. Read More Bone tumor Broken bone Osteomyelitis X-ray Review Date 9/8/2014 Updated ...

  18. Pelvis x-ray

    Science.gov (United States)

    X-ray - pelvis ... Tumors Degenerative conditions of bones in the hips, pelvis, and upper legs ... hip joint Tumors of the bones of the pelvis Sacroiliitis (inflammation of the area where the sacrum ...

  19. Chest X-Ray

    Medline Plus

    Full Text Available ... and use a very small dose of ionizing radiation to produce pictures of the inside of the ... x-ray use a tiny dose of ionizing radiation, the benefit of an accurate diagnosis far outweighs ...

  20. Chest X-Ray

    Medline Plus

    Full Text Available ... Index A-Z Spotlight October is National Breast Cancer Awareness Month Recently posted: Medical Imaging Costs Magnetoencephalography ( ... of lung conditions such as pneumonia, emphysema and cancer. A chest x-ray requires no special preparation. ...

  1. Chest X-Ray

    Medline Plus

    Full Text Available ... chest x-ray is used to evaluate the lungs, heart and chest wall and may be used ... diagnose and monitor treatment for a variety of lung conditions such as pneumonia, emphysema and cancer. A ...

  2. X-Ray Diffraction.

    Science.gov (United States)

    Smith, D. K.; Smith, K. L.

    1980-01-01

    Reviews applications in research and analytical characterization of compounds and materials in the field of X-ray diffraction, emphasizing new developments in applications and instrumentation in both single crystal and powder diffraction. Cites 414 references. (CS)

  3. Chest X-Ray

    Medline Plus

    Full Text Available ... breath, persistent cough, fever, chest pain or injury. It may also be useful to help diagnose and ... have some concerns about chest x-rays. However, it’s important to consider the likelihood of benefit to ...

  4. X-Ray Diffraction.

    Science.gov (United States)

    Smith, D. K.; Smith, K. L.

    1980-01-01

    Reviews applications in research and analytical characterization of compounds and materials in the field of X-ray diffraction, emphasizing new developments in applications and instrumentation in both single crystal and powder diffraction. Cites 414 references. (CS)

  5. Chest X-Ray

    Medline Plus

    Full Text Available ... breath, persistent cough, fever, chest pain or injury. It may also be useful to help diagnose and ... have some concerns about chest x-rays. However, it’s important to consider the likelihood of benefit to ...

  6. Chest X-Ray

    Medline Plus

    Full Text Available ... CT Angiography Video: Myelography Video: CT of the Heart Video: Radioiodine I-131 Therapy Radiology and You ... x-ray is used to evaluate the lungs, heart and chest wall and may be used to ...

  7. Two-dimensional x-ray diffraction

    CERN Document Server

    He, Bob B

    2009-01-01

    Written by one of the pioneers of 2D X-Ray Diffraction, this useful guide covers the fundamentals, experimental methods and applications of two-dimensional x-ray diffraction, including geometry convention, x-ray source and optics, two-dimensional detectors, diffraction data interpretation, and configurations for various applications, such as phase identification, texture, stress, microstructure analysis, crystallinity, thin film analysis and combinatorial screening. Experimental examples in materials research, pharmaceuticals, and forensics are also given. This presents a key resource to resea

  8. X-ray diffraction and surface acoustic wave analysis of BST/Pt/TiO{sub 2}/SiO{sub 2}/Si thin films

    Energy Technology Data Exchange (ETDEWEB)

    Mseddi, Souhir; Hedi Ben Ghozlen, Mohamed [Laboratoire de Physique des Materiaux, Faculte des Sciences de Sfax, Universite de Sfax, 3018 Sfax (Tunisia); Njeh, Anouar [Unite de Physique, Informatique et Matematiques, Faculte des Sciences de Gafsa, Universite de Gafsa, 2112 Gafsa (Tunisia); Schneider, Dieter [Fraunhofer-Institut fuer Material- und Strahltechnologie, Winterbergstrasse 28, 1277 Dresden (Germany); Fuess, Hartmut [Institute of Materials Science, University of Technology, Petersenstr.23, 64287 Darmstadt (Germany)

    2011-11-15

    High dielectric constant and electrostriction property of (Ba, Sr)Ti0{sub 3} (BST) thin films result in an increasing interest for dielectric devices and microwave acoustic resonator. Barium strontium titanate (Ba{sub 0.645}Sr{sub 0.355}TiO{sub 3}) films of about 300 nm thickness are grown on Pt(111)/TiO{sub 2}/SiO{sub 2}/Si(001) substrates by rf magnetron sputtering deposition techniques. X-ray diffraction is applied for the microstructural characterization. The BST films exhibit a cubic perovskite structure with a dense and smooth surface. A laser acoustic waves (LA-waves) technique is used to generate surface acoustic waves (SAW) propagating in the BST films. Young's modulus E and the Poisson ratio {nu} of TiO{sub 2,} Pt and BST films in different propagation directions are derived from the measured dispersion curves. Estimation of BST elastics constants are served in SAW studies. Impact of stratification process on SAW, propagating along [100] and [110] directions of silicon substrate, has been interpreted on the basis of ordinary differential equation (ODE) and stiffness matrix method (SMM). A good agreement is observed between experimental and calculated dispersion curves. The performed calculations are strongly related to the implemented crystallographic data of each layer. Dispersion curves are found to be sensitive to the SAW propagation direction and the stratification process for the explored frequency ranges 50-250 MHz, even though it corresponds to a wave length clearly higher than the whole films thickness.

  9. Bone X-Ray (Radiography)

    Medline Plus

    Full Text Available ... the limitations of Bone X-ray (Radiography)? What is Bone X-ray (Radiography)? An x-ray (radiograph) ... diagnosis and disease management. top of page How is the procedure performed? The technologist, an individual specially ...

  10. Bone X-Ray (Radiography)

    Medline Plus

    Full Text Available ... that might interfere with the x-ray images. Women should always inform their physician and x-ray ... Safety page for more information about radiation dose. Women should always inform their physician or x-ray ...

  11. Lacquer polishing of X-ray optics

    Science.gov (United States)

    Catura, R. C.; Joki, E. G.; Roethig, D. T.; Brookover, W. J.

    1987-01-01

    Techniques for polishing figured X-ray optics by a lacquer-coating process are described. This acrylic lacquer coating has been applied with an optical quality of an eighth-wave in red light and very effectively covers surface roughness with spatial wavelengths less than about 0.2 mm. Tungsten films have been deposited on the lacquer coatings to provide highly efficient X-ray reflectivity.

  12. Extended X-ray absorption fine structure (EXAFS) investigations of Ti bonding environment in sputter-deposited nanocomposite TiBC/a-C thin films

    Energy Technology Data Exchange (ETDEWEB)

    Endrino, J L; Gago, R; Jimenez, I [Instituto de Ciencias de Materiales de Madrid, Consejo Superior de Investigaciones Cientificas, Campus de Cantoblanco, E-28049 Madrid (Spain); Abad, M D; Sanchez-Lopez, J C [Instituto de Ciencia de Materiales de Sevilla, CSIC-Universidad de Sevilla, Avda. Americo Vespucio 49, 41092 Sevilla (Spain); Horwat, D, E-mail: jlendrino@icmm.csic.es [Institut Jean Lamour, Departement CP2S, Nancy Universite, Ecole des Mines, CS14234 Parc de Saurupt, 54042 Nancy Cedex (France)

    2010-06-15

    In this study, we have successfully used the extended X-ray absorption fine structure (EXAFS) technique at the Ti-K edge to extract the local structure in a set of nanocomposite TiBC/a-C coatings deposited by a combined d.c.-pulsed and r.f.-magnetron sputtering deposition process. The sequence of Fourier transform spectra in the deposited films shows that there is an increase in the number of Ti-C bonds in the films of higher carbon content in parallel with the increment of the total carbon content. In addition, Ti-K EXAFS spectra indicate that in all the deposited TiBC/a-C films, first-shell neighbours are in a nearer structural arrangement than the one expected for a bulk hexagonal TiB2, which could be due to the formation of mixed Ti-B-C compound in a structural unit similar to the one found in h-TiB{sub 2}.

  13. Chemical interaction at the buried silicon/zinc oxide thin-film solar cell interface as revealed by hard X-ray photoelectron spectroscopy

    Energy Technology Data Exchange (ETDEWEB)

    Wimmer, M., E-mail: mark.wimmer@helmholtz-berlin.de [Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Hahn-Meitner-Platz 1, 14109 Berlin (Germany); Gerlach, D.; Wilks, R.G.; Scherf, S.; Félix, R. [Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Hahn-Meitner-Platz 1, 14109 Berlin (Germany); Lupulescu, C. [Institute for Optics and Atomic Physics, Technische Universität Berlin, Hardenbergstr. 36, 10623 Berlin (Germany); Ruske, F.; Schondelmaier, G.; Lips, K. [Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Hahn-Meitner-Platz 1, 14109 Berlin (Germany); Hüpkes, J. [Institute for Energy Research, Forschungszentrum Jülich GmbH, Leo-Brandt-Straße, 52425 Jülich (Germany); Gorgoi, M. [Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Hahn-Meitner-Platz 1, 14109 Berlin (Germany); Eberhardt, W. [Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Hahn-Meitner-Platz 1, 14109 Berlin (Germany); Institute for Optics and Atomic Physics, Technische Universität Berlin, Hardenbergstr. 36, 10623 Berlin (Germany); Rech, B. [Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Hahn-Meitner-Platz 1, 14109 Berlin (Germany); Bär, M., E-mail: marcus.baer@helmholtz-berlin.de [Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Hahn-Meitner-Platz 1, 14109 Berlin (Germany); Institut für Physik und Chemie, Brandenburgische Technische Universität Cottbus, Konrad-Wachsmann-Allee 1, 03046 Cottbus (Germany)

    2013-10-15

    Highlights: •We used HAXPES to identify chemical interactions at the buried silicon/aluminum-doped zinc oxide thin-film solar cell interface. •The results indicate a diffusion of zinc and aluminum into the silicon upon annealing procedures which are part of the solar cell processing. •The contamination of the silicon may be detrimental for the solar cell performance. -- Abstract: Hard X-ray photoelectron spectroscopy (HAXPES) is used to identify chemical interactions (such as elemental redistribution) at the buried silicon/aluminum-doped zinc oxide thin-film solar cell interface. Expanding our study of the interfacial oxidation of silicon upon its solid-phase crystallization (SPC), in which we found zinc oxide to be the source of oxygen, in this investigation we address chemical interaction processes involving zinc and aluminum. In particular, we observe an increase of zinc- and aluminum-related HAXPES signals after SPC of the deposited amorphous silicon thin films. Quantitative analysis suggests an elemental redistribution in the proximity of the silicon/aluminum-doped zinc oxide interface – more pronounced for aluminum than for zinc – as explanation. Based on these insights the complex chemical interface structure is discussed.

  14. Intrinsic stress in ZrN thin films: Evaluation of grain boundary contribution from in situ wafer curvature and ex situ x-ray diffraction techniques

    Energy Technology Data Exchange (ETDEWEB)

    Koutsokeras, L. E. [Departement Physique et Mecanique des Materiaux, Institut Pprime, CNRS-Universite de Poitiers-ENSMA, UPR 3346, SP2MI, Teleport 2, Bd M et P Curie, F 86962 Chasseneuil-Futuroscope (France); Department of Materials Science and Engineering, University of Ioannina, Ioannina 45110 (Greece); Abadias, G. [Departement Physique et Mecanique des Materiaux, Institut Pprime, CNRS-Universite de Poitiers-ENSMA, UPR 3346, SP2MI, Teleport 2, Bd M et P Curie, F 86962 Chasseneuil-Futuroscope (France)

    2012-05-01

    Low-mobility materials, like transition metal nitrides, usually undergo large residual stress when sputter-deposited as thin films. While the origin of stress development has been an active area of research for high-mobility materials, atomistic processes are less understood for low-mobility systems. In the present work, the contribution of grain boundary to intrinsic stress in reactively magnetron-sputtered ZrN films is evaluated by combining in situ wafer curvature measurements, providing information on the overall biaxial stress, and ex situ x-ray diffraction, giving information on elastic strain (and related stress) inside crystallites. The thermal stress contribution was also determined from the in situ stress evolution during cooling down, after deposition was stopped. The stress data are correlated with variations in film microstructure and growth energetics, in the 0.13-0.42 Pa working pressure range investigated, and discussed based on existing stress models. At low pressure (high energetic bombardment conditions), a large compressive stress is observed due to atomic peening, which induces defects inside crystallites but also promotes incorporation of excess atoms in the grain boundary. Above 0.3-0.4 Pa, the adatom surface mobility is reduced, leading to the build-up of tensile stress resulting from attractive forces between under-dense neighbouring column boundary and possible void formation, while crystallites can still remain under compressive stress.

  15. Investigation of Optically Modified YBa2Cu3O7–x Films by Means of X-ray Microanalysis Technique

    Directory of Open Access Journals (Sweden)

    Artūras JUKNA

    2014-06-01

    Full Text Available This work reports on investigation of remnant oxygen content in optically-modified regions of 0.3-mm-thick YBa2Cu3O7–x films, patterned by a laser-writing technique in an inert ambient gas atmosphere at room temperature. A laser-treated region of weak superconductivity with dimensions depending on the size of a laser spot, laser power, and initial content of oxygen is characterized by a lower oxygen content, weaker critical magnetic field, and suppressed both the superconducting critical temperature and the critical current density, as compared to the laser untreated regions. Optically induced (cw-laser, 532-nm-wavelength heating strongly affects a non-uniform distribution of remnant oxygen content in the film, depending both on the optical power and beam’s scanning velocity. A level of oxygen depletion and the size of the oxygen-deficient region have been directly estimated from scanning-electron-microscope spectra with the X-ray microanalysis technique. The results of our measurements were compared with results extracted from electric measurements, assuming a correlation between the remnant oxygen content and the electric transport properties of oxygen-deficient YBa2Cu3O7–x films. DOI: http://dx.doi.org/10.5755/j01.ms.20.2.6323

  16. On the question of 3D seed reconstruction in prostate brachytherapy: the determination of x-ray source and film locations

    Energy Technology Data Exchange (ETDEWEB)

    Zhang Mutian [Radiation Safety Office, Columbia University Medical Center, 722 West 168th Street, New York, NY 10032 (United States); Zaider, Marco [Department of Medical Physics, Memorial Sloan-Kettering Cancer Center, 1275 York Avenue, New York, NY 10021 (United States); Worman, Michael [Department of Medical Physics, Memorial Sloan-Kettering Cancer Center, 1275 York Avenue, New York, NY 10021 (United States); Cohen, Gilad [Department of Medical Physics, Memorial Sloan-Kettering Cancer Center, 1275 York Avenue, New York, NY 10021 (United States)

    2004-10-07

    Inaccuracy in seed placement during permanent prostate implants may lead to significant dosimetric deviations from the intended plan. In two recent publications (Todor et al 2002 Phys. Med. Biol. 47 2031-48, Todor et al 2003 Phys. Med. Biol. 48 1153-71), methodology was described for identifying intraoperatively the positions of seeds already implanted, thus allowing re-optimization of the treatment plan and correcting for such seed misplacement. Seed reconstruction is performed using fluoroscopic images and an important (and non-trivial) component of this approach is the ability to accurately determine the position of the gantry relative to the treatment volume. We describe the methodology for acquiring this information, based on the known geometry of six markers attached to the ultrasound probe. This method does not require the C-arm unit to be isocentric and films can be taken with the gantry set at any arbitrary position. This is significant because the patient positioning on the operating table (in the lithotomy position) restricts the range of angles at which films can be taken to a quite narrow (typically {+-}10{sup 0}) interval and, as a general rule, the closer the angles the larger the uncertainty in the seed location reconstruction along the direction from the x-ray source to the film. (note)

  17. DEFORMATION OF SOFT COLLOIDAL CRYSTALLINE STRUCTURE-THEORETICAL CONSIDERATIONS AND EXPERIMENTAL EVIDENCES BY SYNCHROTRON SMALL-ANGLE X-RAY SCATTERING ON TENSILE STRETCHED POLYMERIC LATEX FILM

    Institute of Scientific and Technical Information of China (English)

    Jian-qi Zhang; Yong-feng Men

    2009-01-01

    Films obtained via drying a polymeric latex dispersion are normally colloidal crystalline where latex particles are packed into a face centered cubic (fcc) structure.Different from conventional atomic crystallites or hard sphere colloidal crystallites,the crystalline structure of these films is normally deformable due to the low glass transition temperature of the latex particles.Upon tensile deformation,depending on the drawing direction with respect to the normal of specific crystallographic plane,one observes different crystalline structural changes.Three typical situations where crystallographic c-axis,body diagonal or face diagonal of the fcc structure of the colloidal crystallites being parallel to the stretching direction were investigated.Tilting angle and d-spacing of several crystallographic planes as a function of draw ratio at each situation were derived.Experimental evidences for such relationships were also given by considering in-situ synchrotron small angle X-ray scattering data of a typical latex film during stretching.It turns out that the experimental results are fully in accordance with the mathematical calculations.

  18. X-ray photoelectron spectroscopic and electrochemical impedance spectroscopic analysis of RuO2-Ta2O5 thick film pH sensors.

    Science.gov (United States)

    Manjakkal, Libu; Cvejin, Katarina; Kulawik, Jan; Zaraska, Krzysztof; Socha, Robert P; Szwagierczak, Dorota

    2016-08-10

    The paper reports on investigation of the pH sensing mechanism of thick film RuO2-Ta2O5 sensors by using X-ray photoelectron spectroscopy (XPS) and electrochemical impedance spectroscopy (EIS). Interdigitated conductimetric pH sensors were screen printed on alumina substrates. The microstructure and elemental composition of the films were examined by scanning electron microscopy and energy dispersive spectroscopy. The XPS studies revealed the presence of Ru ions at different oxidation states and the surface hydroxylation of the sensing layer increasing with increasing pH. The EIS analysis carried out in the frequency range 10 Hz-2 MHz showed that the electrical parameters of the sensitive electrodes in the low frequency range were distinctly dependent on pH. The charge transfer and ionic exchange occurring at metal oxide-solution interface were indicated as processes responsible for the sensing mechanism of thick film RuO2-Ta2O5 pH sensors.

  19. Reducing an already low dental diagnostic X-ray dose: does it make sense? Comparison of three cost-utility analysis methods used to assess two dental dose-reduction measures.

    Science.gov (United States)

    Hoogeveen, R C; Sanderink, G C H; van der Stelt, P F; Berkhout, W E R

    2015-01-01

    To find a method that is suitable for providing an objective assessment of the cost effectiveness of a dose-reducing measure used for diagnostic dental X-ray exposures. Three cost-utility analysis (CUA) methods were evaluated by comparing their assessments of two dose-reduction measures, a rectangular collimator and the combination of two devices that reduce the radiation dose received during orthodontic lateral cephalography. The following CUA methods were used: (1) the alpha value (AV), a monetary valuation of dose reduction used in the nuclear industry; (2) the value of a statistical life for valuation of the reduction in stochastic adverse effects; and (3) the time-for-time method, based on the postulate that risk reduction is effective when the number of years of life gained is more than the years that an average worker must work to earn the costs of the risk-reducing measure. The CUA methods were used to determine the minimum number of uses that was required for the dose-reducing device to be cost effective. The methods were assessed for coherence (are comparable results achieved for comparable countries?) and adaptability (can the method be adjusted for age and gender of specific patient groups?). The performance of the time-for-time method was superior to the other methods. Both types of dose-reduction devices tested were assessed as cost effective after a realistic number of uses with all three methods except low AVs. CUA for the methods of X-ray dose reduction can be performed to determine if investment in low dose reduction is cost effective. The time-for-time method proved to be a coherent and versatile method for performing CUA.

  20. X-ray absorption spectroscopy and magnetic circular dichroism studies of L10-Mn-Ga thin films

    OpenAIRE

    Glas, M; Sterwerf, C.; Schmalhorst, J.M.; Ebke, D.; Jenkins, C.; Arenholz, E.; Reiss, G.

    2013-01-01

    Tetragonally distorted \\(\\rm{Mn}_{3-x}\\rm{Ga}_x\\) thin films with \\(0.1< x < 2\\) show a strong perpendicular magnetic anisotropy and low magnetization and thus have the potential to serve as electrodes in spin transfer torque magnetic random access memory. Because a direct capping of these films with MgO is problematic due to oxide formation, we examined the influence of a CoFeB interlayer, and of two different deposition methods for the MgO barrier on the formation of interfacial MnO for \\(\\...

  1. Some simple ideas on x-ray reflection and grazing-incidence diffraction from thin surfactant films

    DEFF Research Database (Denmark)

    Kjær, K.

    1994-01-01

    For Langmuir films of long linear amphiphilic molecules at the air-water interface, grazing-incidence diffraction data resolved in terms of both the horizontal and vertical components of the scattering angle can be evaluated to a fair level of detail by means of a slide rule. Specular reflection...

  2. X-Ray Absorption with Transmission X-Ray Microscopes

    NARCIS (Netherlands)

    de Groot, F.M.F.

    2016-01-01

    In this section we focus on the use of transmission X-ray microscopy (TXM) to measure the XAS spectra. In the last decade a range of soft X-ray and hard X-ray TXM microscopes have been developed, allowing the measurement of XAS spectra with 10–100 nm resolution. In the hard X-ray range the TXM

  3. X-ray Pulsars

    CERN Document Server

    Walter, Roland

    2016-01-01

    X-ray pulsars shine thanks to the conversion of the gravitational energy of accreted material to X-ray radiation. The accretion rate is modulated by geometrical and hydrodynamical effects in the stellar wind of the pulsar companions and/or by instabilities in accretion discs. Wind driven flows are highly unstable close to neutron stars and responsible for X-ray variability by factors $10^3$ on time scale of hours. Disk driven flows feature slower state transitions and quasi periodic oscillations related to orbital motion and precession or resonance. On shorter time scales, and closer to the surface of the neutron star, X-ray variability is dominated by the interactions of the accreting flow with the spinning magnetosphere. When the pulsar magnetic field is large, the flow is confined in a relatively narrow accretion column, whose geometrical properties drive the observed X-ray emission. In low magnetized systems, an increasing accretion rate allows the ignition of powerful explosive thermonuclear burning at t...

  4. Speciation and Lability of Ag-, AgCl- and Ag2S-Nanoparticles in Soil Determined by X-ray Absorption Spectroscopy and Diffusive Gradients in Thin Films

    Science.gov (United States)

    Long-term speciation and lability of silver (Ag-), silver chloride (AgCl-) and silver sulfide nanoparticles (Ag2S-NPs) in soil were studied by X-ray absorption spectroscopy (XAS), and newly developed "nano" Diffusive Gradients in Thin Films (DGT) devices. These nano-D...

  5. Speciation and Lability of Ag-, AgCl- and Ag2S-Nanoparticles in Soil Determined by X-ray Absorption Spectroscopy and Diffusive Gradients in Thin Films

    Science.gov (United States)

    Long-term speciation and lability of silver (Ag-), silver chloride (AgCl-) and silver sulfide nanoparticles (Ag2S-NPs) in soil were studied by X-ray absorption spectroscopy (XAS), and newly developed "nano" Diffusive Gradients in Thin Films (DGT) devices. These nano-D...

  6. Justification and good practice in using handheld portable dental X-ray equipment: a position paper prepared by the European Academy of DentoMaxilloFacial Radiology (EADMFR)

    NARCIS (Netherlands)

    Berkhout, W.E.R.; Suomalainen, A.; Brüllmann, D.; Jacobs, R.; Horner, K.; Stamatakis, H.C.

    2015-01-01

    Handheld portable X-ray devices are increasingly used for intraoral radiography. This development introduces new challenges to staff and patient safety, for which new or revised risk assessments must be made and acted upon prior to use. Major issues might be: difficulties in using rectangular

  7. Comparison between different cost devices for digital capture of X-ray films: an image characteristics detection approach.

    Science.gov (United States)

    Salazar, Antonio José; Camacho, Juan Camilo; Aguirre, Diego Andrés

    2012-02-01

    A common teleradiology practice is digitizing films. The costs of specialized digitizers are very high, that is why there is a trend to use conventional scanners and digital cameras. Statistical clinical studies are required to determine the accuracy of these devices, which are very difficult to carry out. The purpose of this study was to compare three capture devices in terms of their capacity to detect several image characteristics. Spatial resolution, contrast, gray levels, and geometric deformation were compared for a specialized digitizer ICR (US$ 15,000), a conventional scanner UMAX (US$ 1,800), and a digital camera LUMIX (US$ 450, but require an additional support system and a light box for about US$ 400). Test patterns printed in films were used. The results detected gray levels lower than real values for all three devices; acceptable contrast and low geometric deformation with three devices. All three devices are appropriate solutions, but a digital camera requires more operator training and more settings.

  8. Examination of growth kinetics of copper rich Cu(In,Ga)Se{sub 2}-films using synchrotron energy dispersive X-ray diffractometry

    Energy Technology Data Exchange (ETDEWEB)

    Rissom, Thorsten; Mainz, Roland; Kaufmann, Christian A.; Caballero, Raquel; Schock, Hans-Werner [Helmholtz Zentrum Berlin fuer Materialien und Energie, Solar Energy Research, Institute for Technology, Hahn-Meitner Platz 1, 14109 Berlin (Germany); Efimova, Varvara; Hoffmann, Volker [IFW Dresden, Institut fuer Komplexe Materialen, Helmholtzstrasse 20, 01069 Dresden (Germany)

    2011-01-15

    Multistage evaporation processes are capable of producing state of the art Cu(In,Ga)Se{sub 2}-thin-films for use in solar cells. The morphology of films grown by this process changes in a rapid manner as soon as their composition becomes copper rich beyond stoichiometry. For investigation of the structural changes, synchrotron radiation energy-dispersive X-ray diffractometry was used. Cu-rich and Cu-poor absorbers with an in-depth gallium gradient were grown by physical vapor deposition. These were transferred to a thermal processing reaction chamber which allows in-situ characterization. In the Cu-rich case changes in energy and shape of the measured diffraction signals caused by heating the samples could be attributed to the leveling of indium and gallium gradients within the layer. As a secondary method glow discharge optical emission spectroscopy was used to confirm this result. Cu-poor reference samples did not show a similarly significant intermixing of indium and gallium during annealing. We conclude, that the presence of excess copper in the layer at elevated temperatures (>470 C) causes interdiffusion of indium and gallium. (author)

  9. Magnetocrystalline Anisotropy of Magnetic Grains in Co80Pt20:Oxide Thin Films Probed by X-ray Magnetic Circular Dichroism

    Energy Technology Data Exchange (ETDEWEB)

    Zhang, W.; Morton, S. A.; Wong, P. K. J.; Arenholz, E.; Lu, B.; Cheng, T. Y.; Xu, Y. B.; Laan, G. van der; Hu, X.F

    2011-01-12

    Using angle-dependent x-ray magnetic circular dichroism, we have measured magnetic hysteresis loops at the Co L2,3 edges of oxide-doped Co80Pt20 thin films. The magnetocrystalline anisotropy energy (MAE) of the Co atoms, which is the main source of the magnetocrystalline anisotropy of the CoPt magnetic grains, has been determined directly from these element-specific hysteresis loops. When the oxide volume fraction (OVF) is increased from 16.6% to 20.7%, the Co MAE has been found to decrease from 0.117 meV/atom to 0.076 meV/atom. While a larger OVF helps one to achieve a smaller grain size, it reduces the magnetocrystalline anisotropy, as demonstrated unambiguously from the direct Co MAE measurements. Our results suggest that those Co80Pt20:oxide films with an OVF between 19.1% and 20.7% are suitable candidates for high-density magnetic recording.

  10. In situ monitoring of laser-induced periodic surface structures formation on polymer films by grazing incidence small-angle X-ray scattering.

    Science.gov (United States)

    Rebollar, Esther; Rueda, Daniel R; Martín-Fabiani, Ignacio; Rodríguez-Rodríguez, Álvaro; García-Gutiérrez, Mari-Cruz; Portale, Giuseppe; Castillejo, Marta; Ezquerra, Tiberio A

    2015-04-07

    The formation of laser-induced periodic surface structures (LIPSS) on model spin-coated polymer films has been followed in situ by grazing incidence small-angle X-ray scattering (GISAXS) using synchrotron radiation. The samples were irradiated at different repetition rates ranging from 1 up to 10 Hz by using the fourth harmonic of a Nd:YAG laser (266 nm) with pulses of 8 ns. Simultaneously, GISAXS patterns were acquired during laser irradiation. The variation of both the GISAXS signal with the number of pulses and the LIPSS period with laser irradiation time is revealing key kinetic aspects of the nanostructure formation process. By considering LIPSS as one-dimensional paracrystalline lattice and using a correlation found between the paracrystalline disorder parameter, g, and the number of reflections observed in the GISAXS patterns, the variation of the structural order of LIPSS can be assessed. The role of the laser repetition rate in the nanostructure formation has been clarified. For high pulse repetition rates (i.e., 10 Hz), LIPSS evolve in time to reach the expected period matching the wavelength of the irradiating laser. For lower pulse repetition rates LIPSS formation is less effective, and the period of the ripples never reaches the wavelength value. Results support and provide information on the existence of a feedback mechanism for LIPSS formation in polymer films.

  11. Using three-dimensional 3D grazing-incidence small-angle X-ray scattering (GISAXS) analysis to probe pore deformation in mesoporous silica films.

    Science.gov (United States)

    Panduro, Elvia Anabela Chavez; Granlund, Håvard; Sztucki, Michael; Konovalov, Oleg; Breiby, Dag W; Gibaud, Alain

    2014-02-26

    In the past decade, remarkable progress has been made in studying nanoscale objects deposited on surfaces by grazing-incidence small-angle X-ray scattering (GISAXS). However, unravelling the structural properties of mesostructured thin films containing highly organized internal three-dimensional (3D) structures remains a challenging issue, because of the lack of efficient algorithms that allow prediction of the GISAXS intensity patterns. Previous attempts to calculate intensities have mostly been limited to cases of two-dimensional (2D) assemblies of nanoparticles at surfaces, or have been adapted to specific 3D cases. Here, we demonstrate that highly organized 3D mesoscale structures (for example, porous networks) can be modeled by the combined use of established crystallography formalism and the Distorted Wave Born Approximation (DWBA). Taking advantage of the near-zero intensity of symmetry-allowed Bragg reflections, the casual extinction or existence of certain reflections related to the anisotropy of the form factor of the pores can be used as a highly sensitive method to extract structural information. We employ this generic method to probe the slightly compressed anisotropic shape and orientation of pores in a mesoporous silica thin film having P63/mmc symmetry.

  12. Sensitometric comparison of E and F dental radiographic films using manual and automatic processing systems

    Directory of Open Access Journals (Sweden)

    Dabaghi A.

    2008-04-01

    Full Text Available Background and Aim: Processing conditions affect sensitometric properties of X-ray films. In this study, we aimed to evaluate the sensitometric characteristics of InSight (IP, a new F-speed film, in fresh and used processing solutions in dental office condition and compare them with Ektaspeed Plus (EP.Materials and Methods: In this experimental in vitro study, an aluminium step wedge was used to construct characteristic curves for InSight and Ektaspeed Plus films (Kodak Eastman, Rochester, USA.All films were processed in Champion solution (X-ray Iran, Tehran, Iran both manually and automatically in a period of six days. Unexposed films of both types were processed manually and automatically to determine base plus fog density. Speed and film contrast were measured according to ISO definition. Data were analyzed using one-way ANOVA and T tests with P<0.05 as the level of significance.Results: IP was 20 to 22% faster than EP and showed to be an F-speed film when processed in automatic condition and E-F film when processed manually. Also it was F-speed in fresh solution and E-speed in old solution. IP and EP contrasts were similar in automatic processing but EP contrast was higher when processed manually. Both EP and IP films had standard values of base plus fog (<0.35 and B+F densities were decreased in old solution.Conclusion: Based on the results of this study, InSight is a F-speed film with a speed of at least 20% greater than Ektaspeed. In addition, it reduces patient exposure with no damage to image quality.

  13. Morphological Component Analysis for the Inpainting of Grazing Incidence X-Ray Diffraction Images Used for the Structural Characterization of Thin Films

    Directory of Open Access Journals (Sweden)

    Tzagkarakis G.

    2013-11-01

    Full Text Available Grazing Incidence X-ray Diffraction (GIXD is a widely used characterization technique, applied for the investigation of the structure of thin films. As far as organic films are concerned, the confinement of the film to the substrate results in anisotropic 2-dimensional GIXD patterns, such those observed for polythiophene-based films, which are used as active layers in photovoltaic applications. Potential malfunctions of the detectors utilized may distort the quality of the acquired images, affecting thus the analysis process and the structural information derived. Motivated by the success of Morphological Component Analysis (MCA in image processing, we tackle in this study the problem of recovering the missing information in GIXD images due to potential detector’s malfunction. First, we show that the geometrical structures which are present in the GIXD images can be represented sparsely by means of a combination of over-complete transforms, namely, the curvelet and the undecimated wavelet transform, resulting in a simple and compact description of their inherent information content. Then, the missing information is recovered by applying MCA in an inpainting framework, by exploiting the sparse representation of GIXD data in these two over-complete transform domains. The experimental evaluation shows that the proposed approach is highly efficient in recovering the missing information in the form of either randomly burned pixels, or whole burned rows, even at the order of 50% of the total number of pixels. Thus, our approach can be applied for healing any potential problems related to detector performance during acquisition, which is of high importance in synchrotron-based experiments, since the beamtime allocated to users is extremely limited and any technical malfunction could be detrimental for the course of the experimental project. Moreover, the non-necessity of long acquisition times or repeating measurements, which stems from our results

  14. X-ray Reflection

    Science.gov (United States)

    Fabian, A. C.; Ross, R. R.

    2010-12-01

    Material irradiated by X-rays produces backscattered radiation which is commonly known as the Reflection Spectrum. It consists of a structured continuum, due at high energies to the competition between photoelectric absorption and electron scattering enhanced at low energies by emission from the material itself, together with a complex line spectrum. We briefly review the history of X-ray reflection in astronomy and discuss various methods for computing the reflection spectrum from cold and ionized gas, illustrated with results from our own work reflionx. We discuss how the reflection spectrum can be used to obtain the geometry of the accretion flow, particularly the inner regions around black holes and neutron stars.

  15. Synchrotron White Beam X-Ray Topography Characterization of LGX and SXGS Bulk Single Crystals, Thin Films and Piezoelectric Devices

    Science.gov (United States)

    2007-04-27

    will be carried out on: (1) bulk LGX crystals grown using the Czochralski technique, (2) homo- and heteroepitaxial thin films of LGX, and (3...Papers published in peer-reviewed journals (N/A for none) 1. J. Luo, D. Shah, C.F. Klemenz, M. Dudley and H. Chen, “The Czochralski Growth of Large...Total of 36 topographs of the longitudinal surface of 00-A1-08 LGT-X boule were recorded with the method described above. The topographs are

  16. Dislocation and Elastic Strain in an InN Film Characterized by Synchrotron Radiation X-Ray Diffraction and Rutherford Backscattering/Channeling

    Institute of Scientific and Technical Information of China (English)

    CHENG Feng-Feng; FA Tao; WANG Xin-Qiang; YAO Shu-De

    2012-01-01

    Dislocation information and strain-related tetragonal distortion as well as crystalline qualities of a 2-μm-thick InN film grown by molecular beam epitaxy (MBE) are characterized by Rutherford backscattering/channeling (RBS/C) and synchrotron radiation x-ray diffraction (SR-XRD).The minimum yield xmin=2.5% deduced from the RBS/C results indicates a fairly good crystalline quality.From the SR-XRD results,we obtain the values of the screw and edge densities to be ρscrew =7.0027 X 109 and ρedge =8.6115 × 109 cm-2,respectively.The tetragonal distortion of the sample is found to be -0.27 % by angular scans,which is close to the -0.28 % derived by SR-XRD.The value of |e(⊥)/e‖| =0.6742 implies that the InN layer is much stiffer along the a axis than that along the c axis,where e‖ is the parallel elastic strain,and e⊥ is the perpendicular elastic strain.Photoluminescence results reveal a main peak of 0.653eV with the linewidth of 60meV,additional shoulder band could be due to impurities and related defects.%Dislocation information and strain-related tetragonal distortion as well as crystalline qualities of a 2-μm-thick InN film grown by molecular beam epitaxy (MBE) are characterized by Rutherford backscattering/'channeling (RBS/C) and synchrotron radiation x-ray diffraction (SR-XRD). The minimum yield Xmin=2.5% deduced from the RBS/C results indicates a fairly good crystalline quality. From the SR-XRD results, we obtain the values of the screw and edge densities to be pscrew = 7.0027 ×109 and pedge = 8.6115 ×109 cm-2, respectively. The tetragonal distortion of the sample is found to be-0.27% by angular scans, which is close to the -0.28 % derived by SR-XRD. The value of |e⊥/e|| | = 0.6742 implies that the InN layer is much stiffer along the a axis than that along the c axis, where e|| is the parallel elastic strain, and e⊥ is the perpendicular elastic strain. Photoluminescence results reveal a main peak of 0.653eV with the linewidth of 60me

  17. Twin domain imaging in topological insulator Bi2Te3 and Bi2Se3 epitaxial thin films by scanning X-ray nanobeam microscopy and electron backscatter diffraction

    Science.gov (United States)

    Harcuba, Petr; Veselý, Jozef; Lesnik, Andreas; Bauer, Guenther; Springholz, Gunther; Holý, Václav

    2017-01-01

    The twin distribution in topological insulators Bi2Te3 and Bi2Se3 was imaged by electron backscatter diffraction (EBSD) and scanning X-ray diffraction microscopy (SXRM). The crystal orientation at the surface, determined by EBSD, is correlated with the surface topography, which shows triangular pyramidal features with edges oriented in two different orientations rotated in the surface plane by 60°. The bulk crystal orientation is mapped out using SXRM by measuring the diffracted X-ray intensity of an asymmetric Bragg peak using a nano-focused X-ray beam scanned over the sample. By comparing bulk- and surface-sensitive measurements of the same area, buried twin domains not visible on the surface are identified. The lateral twin domain size is found to increase with the film thickness.

  18. Femtosecond X-ray magnetic circular dichroism absorption spectroscopy at an X-ray free electron laser

    Energy Technology Data Exchange (ETDEWEB)

    Higley, Daniel J., E-mail: dhigley@stanford.edu; Yuan, Edwin [SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, California 94025 (United States); Department of Applied Physics, Stanford University, Stanford, California 94305 (United States); Hirsch, Konstantin; Dakovski, Georgi L.; Jal, Emmanuelle; Lutman, Alberto A.; Coslovich, Giacomo; Hart, Philip; Hoffmann, Matthias C.; Mitra, Ankush; Moeller, Stefan; Ohldag, Hendrik; Seaberg, Matthew; Stöhr, Joachim; Nuhn, Heinz-Dieter; Reid, Alex H.; Dürr, Hermann A.; Schlotter, William F. [SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, California 94025 (United States); Liu, Tianmin; MacArthur, James P. [SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, California 94025 (United States); Department of Physics, Stanford University, Stanford, California 94305 (United States); and others

    2016-03-15

    X-ray magnetic circular dichroism spectroscopy using an X-ray free electron laser is demonstrated with spectra over the Fe L{sub 3,2}-edges. The high brightness of the X-ray free electron laser combined with high accuracy detection of incident and transmitted X-rays enables ultrafast X-ray magnetic circular dichroism studies of unprecedented sensitivity. This new capability is applied to a study of all-optical magnetic switching dynamics of Fe and Gd magnetic sublattices in a GdFeCo thin film above its magnetization compensation temperature.

  19. Chest X-Ray

    Medline Plus

    Full Text Available ... Therapy November 8 is the International Day of Radiology (IDoR) Radiology and You Sponsored by Image/Video Gallery Your Radiologist Explains Chest X-ray Transcript Welcome to Radiology Info dot org! Hello, I’m Dr. Geoffrey ...

  20. Preservation of the morphology of a self-encapsulated thin titania film in a functional multilayer stack: an X-ray scattering study.

    Science.gov (United States)

    Perlich, Jan; Memesa, Mine; Diethert, Alexander; Metwalli, Ezzeldin; Wang, Weinan; Roth, Stephan V; Timmann, Andreas; Gutmann, Jochen S; Müller-Buschbaum, Peter

    2009-03-23

    Tailoring of the titania morphology is achieved by the combination of a triblock copolymer, acting as structure-directing agent, and a sol-gel chemistry enabling the incorporation of the provided inorganic material (titania) into the selected phase of the triblock copolymer. Spin-coating of the solution on FTO-coated glass, followed by plasma etching and calcination of the thin film results in the formation of self-encapsulated crystalline titania nanostructures. The fabricated nanostructures are coated stepwise with dye, conductive polymers and gold forming a functional multilayer stack. An advanced small-angle scattering technique probing the sample with X-ray synchrotron radiation under grazing incidence (GISAXS) is employed for the characterization of the preparation route, as scattering allows accessing the structure inside the multilayers. The tailored titania morphology is preserved during the preparation route towards the functional multilayer stack of a photovoltaic demonstration cell. Two clearly distinguishable structures originate from the substrate and the titania templated by the triblock copolymer; hence the other layers induce no additional structures. Therefore, this investigation provides the evidence that the effort spent to tailor the morphology is justified by the preservation of the self-encapsulated titania morphology that is created by the structure-directing agent throughout the functional multilayer stack build-up.

  1. Hard X-ray photoelectron spectroscopy of Li{sub x}Ni{sub 1−x}O epitaxial thin films with a high lithium content

    Energy Technology Data Exchange (ETDEWEB)

    Kumara, L. S. R., E-mail: KUMARA.Rosantha@nims.go.jp; Yang, Anli [Synchrotron X-ray Station at SPring-8, National Institute for Materials Science (NIMS), 1-1-1 Kouto, Sayo, Hyogo 679-5148 (Japan); Sakata, Osami, E-mail: SAKATA.Osami@nims.go.jp [Synchrotron X-ray Station at SPring-8, National Institute for Materials Science (NIMS), 1-1-1 Kouto, Sayo, Hyogo 679-5148 (Japan); Synchrotron X-ray Group, Quantum Beam Unit, NIMS, 1-1-1 Kouto, Sayo, Hyogo 679-5148 (Japan); Department of Innovative and Engineered Materials, Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology, 4259-J3-16, Nagatsuta, Midori, Yokohama 226-8502 (Japan); Yamauchi, Ryosuke; Matsuda, Akifumi; Yoshimoto, Mamoru [Department of Innovative and Engineered Materials, Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology, 4259-J3-16, Nagatsuta, Midori, Yokohama 226-8502 (Japan); Taguchi, Munetaka [Graduate School of Materials Science, Nara Institute of Science and Technology (NAIST), Ikoma, Nara 630-0192 (Japan)

    2014-07-28

    The core-level and valence-band electronic structures of Li{sub x}Ni{sub 1−x}O epitaxial thin films with x = 0, 0.27, and 0.48 were studied by hard X-ray photoelectron spectroscopy. A double peak structure, consisting of a main peak and a shoulder peak, and a satellite structure were observed in the Ni 2p{sub 3/2} core-level spectra. The intensity ratio of the shoulder to main peak in this double peak structure increased with increasing lithium content in Li{sub x}Ni{sub 1−x}O. This lithium doping dependence of the Ni 2p{sub 3/2} core-level spectra was investigated using an extended cluster model, which included the Zhang–Rice (ZR) doublet bound states arising from a competition between O 2p – Ni 3d hybridization and the Ni on-site Coulomb interaction. The results indicated that the change in the intensity ratio in the main peak is because of a reduction in the ZR doublet bound states from lithium substitutions. This strongly suggests that holes compensating Li doping in Li{sub x}Ni{sub 1−x}O are of primarily ZR character.

  2. High resolution x-ray diffraction study of the substrate temperature and thickness dependent microstructure of reactively sputtered epitaxial ZnO films

    KAUST Repository

    Singh, Devendra

    2017-08-24

    Epitaxial ZnO films were grown on c-sapphire by reactive sputtering of zinc target in Ar-O2 mixture. High resolution X-ray diffraction measurements were carried out to obtain lateral and vertical coherence lengths, crystallite tilt and twist, micro-strain and densities of screw and edge dislocations in epilayers of different thickness (25 - 200 nm) and those grown at different temperatures (100 - 500 °C). phgr-scans indicate epitaxial growth in all the cases, although epilayers grown at lower substrate temperatures (100 °C and 200 °C) and those of smaller thickness (25 nm and 50 nm) display inferior microstructural parameters. This is attributed to the dominant presence of initially grown strained 2D layer and subsequent transition to an energetically favorable mode. With increase in substrate temperature, the transition shifts to lower thickness and growth takes place through the formation of 2D platelets with intermediate strain, over which 3D islands grow. Consequently, 100 nm thick epilayers grown at 300 °C display the best microstructural parameters (micro-strain ~1.2 x 10-3, screw and edge dislocation densities ~1.5 x 1010 cm-2 and ~2.3 x 1011 cm-2, respectively). A marginal degradation of microstructural parameters is seen in epilayers grown at higher substrate temperatures, due to the dominance of 3D hillock type growth.

  3. Structural formation of HDPE in blow film molding: analysis in small angle X-ray scattering; Formacao de estrutura cristalina do HDPE em filmes moldados por sopro: analises em espalhamento de raio-X a baixo angulo - SAXS

    Energy Technology Data Exchange (ETDEWEB)

    Tercariol, Wilman R.; Bernardi, Alessandro; Zanata, Fabiano; Farah, Marcelo [Braskem Petroquimica S.A., Triunfo, RS (Brazil). Centro de Tecnologia e Inovacao]. E-mail: marcelo.farah@braskem.com.br; Marinelli, Alessandra L.; Bretas, Rosario E.S. [Universidade Federal de Sao Carlos (UFSCar), Sao Carlos, SP (Brazil). Centro de Caracterizacao e Desenvolvimento de Materiais; Plivelic, Tomas; Torriani, Iris [Laboratorio Nacional de Luz Sincrotron (LNLS), Campinas, SP (Brazil)

    2005-07-01

    The correlation among processing-structure-properties is the way for understanding materials behaviors. Using sophisticate techniques as SAXS (small angle X-ray scattering is possible to evaluate the orientation, crystalline parameters (all structure parameter) and so correlated with processing and properties. In this work a fast evaluation of SAXS results over HDPE was done and the correlations with film blown molded were performed. The results indicate how useful SAXS technique could be, and how the direct visualization can provide information of the crystalline structure. The results shown were very dependent of processing parameters. (author)

  4. Elimination of X-Ray Diffraction through Stimulated X-Ray Transmission.

    Science.gov (United States)

    Wu, B; Wang, T; Graves, C E; Zhu, D; Schlotter, W F; Turner, J J; Hellwig, O; Chen, Z; Dürr, H A; Scherz, A; Stöhr, J

    2016-07-08

    X-ray diffractive imaging with laterally coherent x-ray free-electron laser (XFEL) pulses is increasingly utilized to obtain ultrafast snapshots of matter. Here we report the amazing disappearance of single-shot charge and magnetic diffraction patterns recorded with resonantly tuned, narrow bandwidth XFEL pulses. Our experimental results reveal the exquisite sensitivity of single-shot charge and magnetic diffraction patterns of a magnetic film to the onset of field-induced stimulated elastic x-ray forward scattering. The loss in diffraction contrast, measured over 3 orders of magnitude in intensity, is in remarkable quantitative agreement with a recent theory that is extended to include diffraction.

  5. Dental Exam for Children

    Science.gov (United States)

    ... they're most treatable. When to have a dental exam Various factors might determine how frequently your ... wisdom teeth (third molars) at the appropriate age. Dental X-ray A dental X-ray (radiograph) allows ...

  6. X-Ray Astronomy

    Science.gov (United States)

    Wu, S. T.

    2000-01-01

    Dr. S. N. Zhang has lead a seven member group (Dr. Yuxin Feng, Mr. XuejunSun, Mr. Yongzhong Chen, Mr. Jun Lin, Mr. Yangsen Yao, and Ms. Xiaoling Zhang). This group has carried out the following activities: continued data analysis from space astrophysical missions CGRO, RXTE, ASCA and Chandra. Significant scientific results have been produced as results of their work. They discovered the three-layered accretion disk structure around black holes in X-ray binaries; their paper on this discovery is to appear in the prestigious Science magazine. They have also developed a new method for energy spectral analysis of black hole X-ray binaries; four papers on this topics were presented at the most recent Atlanta AAS meeting. They have also carried Monte-Carlo simulations of X-ray detectors, in support to the hardware development efforts at Marshall Space Flight Center (MSFC). These computation-intensive simulations have been carried out entirely on the computers at UAH. They have also carried out extensive simulations for astrophysical applications, taking advantage of the Monte-Carlo simulation codes developed previously at MSFC and further improved at UAH for detector simulations. One refereed paper and one contribution to conference proceedings have been resulted from this effort.

  7. X-ray lithography masking

    Science.gov (United States)

    Smith, Henry I. (Inventor); Lim, Michael (Inventor); Carter, James (Inventor); Schattenburg, Mark (Inventor)

    1998-01-01

    X-ray masking apparatus includes a frame having a supporting rim surrounding an x-ray transparent region, a thin membrane of hard inorganic x-ray transparent material attached at its periphery to the supporting rim covering the x-ray transparent region and a layer of x-ray opaque material on the thin membrane inside the x-ray transparent region arranged in a pattern to selectively transmit x-ray energy entering the x-ray transparent region through the membrane to a predetermined image plane separated from the layer by the thin membrane. A method of making the masking apparatus includes depositing back and front layers of hard inorganic x-ray transparent material on front and back surfaces of a substrate, depositing back and front layers of reinforcing material on the back and front layers, respectively, of the hard inorganic x-ray transparent material, removing the material including at least a portion of the substrate and the back layers of an inside region adjacent to the front layer of hard inorganic x-ray transparent material, removing a portion of the front layer of reinforcing material opposite the inside region to expose the surface of the front layer of hard inorganic x-ray transparent material separated from the inside region by the latter front layer, and depositing a layer of x-ray opaque material on the surface of the latter front layer adjacent to the inside region.

  8. Performance of personnel film dosemeter exposed to lightly filtered x-ray beams; Desempenho de um dosimetro pessoal do tipo filme em feixes de radiacao pouco filtrados

    Energy Technology Data Exchange (ETDEWEB)

    Baptista Neto, Annibal Theotonio; Silva, Teogenes Augusto da [Centro de Desenvolvimento da Tecnologia Nuclear (CDTN), Belo Horizonte, MG (Brazil)]. E-mail: annibal@cdtn.br; silvata@cdtn.br

    2005-07-01

    Usually personal dosemeters for individual monitoring of workers are calibrated in X and gamma reference radiations adopted worldwide. As workers are rarely exposed to radiation beams similar to those used in the calibration, it is needed to know the influence of the energy variation in the dosemeter response. Thirty dosemeters of the dosimetry system of the Centro de Desenvolvimento da Tecnologia Nuclear were irradiated at the University of Wisconsin Radiation Calibration Laboratory in lightly filtered x-ray beams. The performance of the dosimeter showed that, in spite of the trend to underestimate the true dose value in about 10%, all dosemeters had a satisfactory response, considering the international acceptable accuracy limits for individual monitoring. (author)

  9. X-ray scattering from liquid interfaces

    Institute of Scientific and Technical Information of China (English)

    2006-01-01

    Synchrotron radiation X-ray scattering is a useful tool for structural characterization of liquid interfaces.Specular refiectivity provides precise measurement of the interfacial widths and of the ordering of surfactants adsorbed to these interfaces. Diffuse scattering gives information on phase transitions and domain formation in surfactant monolayers and on interfacial fluctuations confined by and coupled across fluidic films.

  10. Bone X-Ray (Radiography)

    Medline Plus

    Full Text Available ... the body. X-rays are the oldest and most frequently used form of medical imaging. A bone ... bones. top of page How should I prepare? Most bone x-rays require no special preparation. You ...

  11. Bone X-Ray (Radiography)

    Medline Plus

    Full Text Available ... tissue shows up in shades of gray and air appears black. Until recently, x-ray images were ... position possible that still ensures x-ray image quality. top of page Who interprets the results and ...

  12. Soft X-ray Imaging

    Energy Technology Data Exchange (ETDEWEB)

    Seely, John

    1999-05-20

    The contents of this report cover the following: (1) design of the soft x-ray telescope; (2) fabrication and characterization of the soft x-ray telescope; and (3) experimental implementation at the OMEGA laser facility.

  13. Bone X-Ray (Radiography)

    Medline Plus

    Full Text Available ... of page What are some common uses of the procedure? A bone x-ray is used to: ... and x-rays. top of page What does the equipment look like? The equipment typically used for ...

  14. Bone X-Ray (Radiography)

    Medline Plus

    Full Text Available ... standards used by radiology professionals. Modern x-ray systems have very controlled x-ray beams and dose control methods to minimize stray (scatter) radiation. This ensures ...

  15. Bone X-Ray (Radiography)

    Medline Plus

    Full Text Available ... current x-ray images for diagnosis and disease management. top of page How is the procedure performed? ... position possible that still ensures x-ray image quality. top of page Who interprets the results and ...

  16. Bone X-Ray (Radiography)

    Medline Plus

    Full Text Available ... Us News Physician Resources Professions Site Index A-Z X-ray (Radiography) - Bone Bone x-ray uses ... assess trauma patients in emergency departments. A CT scan can image complicated fractures, subtle fractures or dislocations. ...

  17. Bone X-Ray (Radiography)

    Medline Plus

    Full Text Available ... patient. top of page How does the procedure work? X-rays are a form of radiation like ... very controlled x-ray beams and dose control methods to minimize stray (scatter) radiation. This ensures that ...

  18. Abdomen X-Ray (Radiography)

    Science.gov (United States)

    ... Professions Site Index A-Z X-ray (Radiography) - Abdomen Abdominal x-ray uses a very small dose ... to produce pictures of the inside of the abdominal cavity. It is used to evaluate the stomach, liver, ...

  19. Bone X-Ray (Radiography)

    Medline Plus

    Full Text Available ... radiation like light or radio waves. X-rays pass through most objects, including the body. Once it ... organs, allow more of the x-rays to pass through them. As a result, bones appear white ...

  20. Bone X-Ray (Radiography)

    Medline Plus

    Full Text Available ... current x-ray images for diagnosis and disease management. top of page How is the procedure performed? ... position possible that still ensures x-ray image quality. top of page Who interprets the results and ...

  1. Bone X-Ray (Radiography)

    Medline Plus

    Full Text Available ... and x-rays. A Word About Minimizing Radiation Exposure Special care is taken during x-ray examinations ... patient's body not being imaged receive minimal radiation exposure. top of page What are the limitations of ...

  2. Bone X-Ray (Radiography)

    Medline Plus

    Full Text Available ... fracture. guide orthopedic surgery, such as spine repair/fusion, joint replacement and fracture reductions. look for injury, ... and Media Arthritis X-ray, Interventional Radiology and Nuclear Medicine Radiation Safety Images related to X-ray ( ...

  3. Bone X-Ray (Radiography)

    Medline Plus

    Full Text Available ... of page What are some common uses of the procedure? A bone x-ray is used to: ... and x-rays. top of page What does the equipment look like? The equipment typically used for ...

  4. Development and applications of grazing exit micro X-ray fluorescence instrument using a polycapillary X-ray lens*1

    Science.gov (United States)

    Emoto, T.; Sato, Y.; Konishi, Y.; Ding, X.; Tsuji, K.

    2004-08-01

    A polycapillary X-ray lens is an effective optics to obtain a μm-size X-ray beam for micro-X-ray fluorescence spectrometry (μ-XRF). We developed a μ-XRF instrument using a polycapillary X-ray lens, which also enabled us to perform Grazing Exit μ-XRF (GE-μ-XRF). The evaluated diameter of the primary X-ray beam was 48 μm at the focal distance of the X-ray lens. Use of this instrument enabled two-dimensional mapping of the elemental distributions during growth of the plant "Quinoa". The results of the mapping revealed elemental transition during growth. In addition, a small region of thin film was analyzed by GE-μ-XRF. We expect that GE-μ-XRF will become an effective method of estimating the film thickness of a small region.

  5. Development and applications of grazing exit micro X-ray fluorescence instrument using a polycapillary X-ray lens

    Energy Technology Data Exchange (ETDEWEB)

    Emoto, T.; Sato, Y.; Konishi, Y.; Ding, X.; Tsuji, K. E-mail: tsuji@a-chem.eng.osaka-cu.ac.jp

    2004-08-31

    A polycapillary X-ray lens is an effective optics to obtain a {mu}m-size X-ray beam for micro-X-ray fluorescence spectrometry ({mu}-XRF). We developed a {mu}-XRF instrument using a polycapillary X-ray lens, which also enabled us to perform Grazing Exit {mu}-XRF (GE-{mu}-XRF). The evaluated diameter of the primary X-ray beam was 48 {mu}m at the focal distance of the X-ray lens. Use of this instrument enabled two-dimensional mapping of the elemental distributions during growth of the plant 'Quinoa'. The results of the mapping revealed elemental transition during growth. In addition, a small region of thin film was analyzed by GE-{mu}-XRF. We expect that GE-{mu}-XRF will become an effective method of estimating the film thickness of a small region.

  6. Glancing angle synchrotron X-ray diffraction

    Energy Technology Data Exchange (ETDEWEB)

    Cernik, R.J. [Daresbury Lab., Warrington, WA (United States)

    1996-09-01

    This paper describes in basic detail some of the techniques that can be used to study thin films and surfaces. These are all in the X-ray region and cover reflectivity, diffraction form polycrystalline films, textured films and single crystal films. Other effects such as fluorescence and diffuse scattering are mentioned but not discussed in detail. Two examples of the reflectivity from multilayers and the diffraction from iron oxide films are discussed. The advantages of the synchrotron for these studies is stressed and the experimental geometries that can be employed are described i detail. A brief bibliography is provided at the end to accompany this part of the 1996 Frascati school.

  7. X-Ray Exam: Hip

    Science.gov (United States)

    ... Old Feeding Your 1- to 2-Year-Old X-Ray Exam: Hip KidsHealth > For Parents > X-Ray Exam: Hip A A A What's in ... español Radiografía: cadera What It Is A hip X-ray is a safe and painless test that ...

  8. X-Ray Exam: Finger

    Science.gov (United States)

    ... Old Feeding Your 1- to 2-Year-Old X-Ray Exam: Finger KidsHealth > For Parents > X-Ray Exam: Finger A A A What's in ... español Radiografía: dedo What It Is A finger X-ray is a safe and painless test that ...

  9. X-Ray Exam: Foot

    Science.gov (United States)

    ... Old Feeding Your 1- to 2-Year-Old X-Ray Exam: Foot KidsHealth > For Parents > X-Ray Exam: Foot A A A What's in ... español Radiografía: pie What It Is A foot X-ray is a safe and painless test that ...

  10. X-Ray Exam: Wrist

    Science.gov (United States)

    ... Old Feeding Your 1- to 2-Year-Old X-Ray Exam: Wrist KidsHealth > For Parents > X-Ray Exam: Wrist A A A What's in ... español Radiografía: muñeca What It Is A wrist X-ray is a safe and painless test that ...

  11. X-Ray Exam: Ankle

    Science.gov (United States)

    ... Old Feeding Your 1- to 2-Year-Old X-Ray Exam: Ankle KidsHealth > For Parents > X-Ray Exam: Ankle A A A What's in ... español Radiografía: tobillo What It Is An ankle X-ray is a safe and painless test that ...

  12. X-Ray Exam: Pelvis

    Science.gov (United States)

    ... Old Feeding Your 1- to 2-Year-Old X-Ray Exam: Pelvis KidsHealth > For Parents > X-Ray Exam: Pelvis A A A What's in ... español Radiografía: pelvis What It Is A pelvis X-ray is a safe and painless test that ...

  13. X-Ray Exam: Forearm

    Science.gov (United States)

    ... Old Feeding Your 1- to 2-Year-Old X-Ray Exam: Forearm KidsHealth > For Parents > X-Ray Exam: Forearm A A A What's in ... español Radiografía: brazo What It Is A forearm X-ray is a safe and painless test that ...

  14. X-ray selected BALQSOs

    CERN Document Server

    Page, M J; Ceballos, M; Corral, A; Ebrero, J; Esquej, P; Krumpe, M; Mateos, S; Rosen, S; Schwope, A; Streblyanska, A; Symeonidis, M; Tedds, J A; Watson, M G

    2016-01-01

    We study a sample of six X-ray selected broad absorption line (BAL) quasi-stellar objects (QSOs) from the XMM-Newton Wide Angle Survey. All six objects are classified as BALQSOs using the classic balnicity index, and together they form the largest sample of X-ray selected BALQSOs. We find evidence for absorption in the X-ray spectra of all six objects. An ionized absorption model applied to an X-ray spectral shape that would be typical for non-BAL QSOs (a power law with energy index alpha=0.98) provides acceptable fits to the X-ray spectra of all six objects. The optical to X-ray spectral indices, alpha_OX, of the X-ray selected BALQSOs, have a mean value of 1.69 +- 0.05, which is similar to that found for X-ray selected and optically selected non-BAL QSOs of similar ultraviolet luminosity. In contrast, optically-selected BALQSOs typically have much larger alpha_OX and so are characterised as being X-ray weak. The results imply that X-ray selection yields intrinsically X-ray bright BALQSOs, but their X-ray sp...

  15. X-ray Crystallography Facility

    Science.gov (United States)

    2000-01-01

    Edward Snell, a National Research Council research fellow at NASA's Marshall Space Flight Center (MSFC), prepares a protein crystal for analysis by x-ray crystallography as part of NASA's structural biology program. The small, individual crystals are bombarded with x-rays to produce diffraction patterns, a map of the intensity of the x-rays as they reflect through the crystal.

  16. Comparison between differently priced devices for digital capture of X-ray films using computed tomography as a gold standard: a multireader-multicase receiver operating characteristic curve study.

    Science.gov (United States)

    Salazar, Antonio J; Camacho, Juan Camilo; Aguirre, Diego Andrés

    2011-05-01

    Film digitizers are a specialized technology that is available for scanning X-ray radiographs; however, their cost makes them unaffordable for developing countries. Thus, less expensive alternatives are used. The purpose of this study was to compare three devices for digital capture of X-ray films: a film digitizer (US $15,000), a flatbed scanner (US $1800), and a 10-megapixel digital camera (US $450), in terms of diagnostic accuracy, defined as the area under the receiver operating characteristic curves and computed tomography as the gold standard. The sample included 136 chest X-ray cases with computed tomography confirmation of the presence or absence of pneumothorax, interstitial opacities, or nodules. The readers were six radiologists who made observations of eight variables for each digital capture of the X-ray films: three main variables to determine the accuracy in the detection of the above-mentioned pathologies, four secondary variables to categorize other pathological classifications, and one variable regarding digital image quality. The receiver operating characteristic curves for each device and pathology were very similar. For the main variables, there was no significant statistical difference in diagnostic accuracy between the devices. For the secondary variables, >84% of cases were correctly classified, even those that were classified with the lowest image quality. High accuracy was determined for the three main variables (0.75 to 0.96), indicating good performance for all tested devices, despite their very different prices. Choosing a device for a teleradiology service should involve additional factors, such as capture time, maintenance concerns, and training requirements.

  17. A comparative transmission electron microscopy, energy dispersive x-ray spectroscopy and spatially resolved micropillar compression study of the yttria partially stabilised zirconia - porcelain interface in dental prosthesis

    Energy Technology Data Exchange (ETDEWEB)

    Lunt, Alexander J.G., E-mail: alexander.lunt@chch.ox.ac.uk [Department of Engineering Science, University of Oxford, Parks Road, Oxford, Oxfordshire OX1 3PJ (United Kingdom); Mohanty, Gaurav, E-mail: gaurav.mohanty@empa.ch [EMPA Materials Science & Technology, Feuerwerkerstrasse 39, CH-3602 Thun (Switzerland); Ying, Siqi, E-mail: siqi.ying@eng.ox.ac.uk [Department of Engineering Science, University of Oxford, Parks Road, Oxford, Oxfordshire OX1 3PJ (United Kingdom); Dluhoš, Jiří, E-mail: jiri.dluhos@tescan.cz [TESCAN Brno, s.r.o., Libušina tř. 1, 623 00 Brno-Kohoutovice (Czech Republic); Sui, Tan, E-mail: tan.sui@eng.ox.ac.uk [Department of Engineering Science, University of Oxford, Parks Road, Oxford, Oxfordshire OX1 3PJ (United Kingdom); Neo, Tee K., E-mail: neophyte@singnet.com.sg [Specialist Dental Group, Mount Elizabeth Orchard, 3 Mount Elizabeth, #08-03/08-08/08-10, 228510 (Singapore); Michler, Johann, E-mail: johann.michler@empa.ch [EMPA Materials Science & Technology, Feuerwerkerstrasse 39, CH-3602 Thun (Switzerland); Korsunsky, Alexander M., E-mail: alexander.korsunsky@eng.ox.ac.uk [Department of Engineering Science, University of Oxford, Parks Road, Oxford, Oxfordshire OX1 3PJ (United Kingdom)

    2015-12-01

    Recent studies into the origins of failure of yttria partially stabilised zirconia–porcelain veneered prosthesis have revealed the importance of micro-to-nano scale characterisation of this interface zone. Current understanding suggests that the heat treatment, residual stresses and varying microstructure at this location may contribute to near-interface porcelain chipping. In this study the chemical, microstructural and mechanical property variation across the interfacial zone has been characterised at two differing length scales and using three independent techniques; energy dispersive X-ray spectroscopy, transmission electron microscopy and micropillar compression. Energy dispersive X-ray spectroscopy mapping of the near-interface region revealed, for the first time, that the diffusional lengths of twelve principal elements are limited to within 2–6 μm of the interface. This study also revealed that 0.2–2 μm diameter zirconia grains had become detached from the bulk and were embedded in the near-interface porcelain. Transmission electron microscopy analysis demonstrated the presence of nanoscale spherical features, indicative of tensile creep induced voiding, within the first 0.4–1.5 μm from the interface. Within zirconia, variations in grain size and atomistic structure were also observed within the 3 μm closest to the interface. Micropillar compression was performed over a 100 μm range on either side of the interface at the spatial resolution of 5 μm. This revealed an increase in zirconia and porcelain loading modulus at close proximities (< 5 μm) to the interface and a decrease in zirconia modulus at distances between 6 and 41 μm from this location. The combination of the three experimental techniques has revealed intricate details of the microstructural, chemical and consequently mechanical heterogeneities in the YPSZ–porcelain interface, and demonstrated that the length scales typically associated with this behaviour are approximately ± 5

  18. SMM x ray polychromator

    Science.gov (United States)

    Saba, J. L. R.

    1993-01-01

    The objective of the X-ray Polychromator (XRP) experiment was to study the physical properties of solar flare plasma and its relation to the parent active region to understand better the flare mechanism and related solar activity. Observations were made to determine the temperature, density, and dynamic structure of the pre-flare and flare plasma as a function of wavelength, space and time, the extent to which the flare plasma departs from thermal equilibrium, and the variation of this departure with time. The experiment also determines the temperature and density structure of active regions and flare-induced changes in the regions.

  19. X-ray today

    Energy Technology Data Exchange (ETDEWEB)

    Neitzel, U. [Philips Medical Systems, Hamburg (Germany)

    2001-09-01

    The interest attracted by the new imaging modalities tends to overshadow the continuing importance of projection radiography and fluoroscopy. Nevertheless, projection techniques still represent by far the greatest proportion of diagnostic imaging examinations, and play an essential role in the growing number of advanced interventional procedures. This article describes some of the latest developments in X-ray imaging technology, using two products from the Philips range as examples: the Integris Allura cardiovascular system with 3D image reconstruction, and the BV Pulsera: a high-end, multi-functional mobile C-arm system with cardiac capabilities. (orig.)

  20. Towards brilliant, compact x-ray sources: a new x-ray photonic device

    Science.gov (United States)

    Scherer, Brian; Mandal, Sudeep; Salisbury, Joshua; Edic, Peter; Hopkins, Forrest; Lee, Susanne M.

    2017-05-01

    General Electric has designed an innovative x-ray photonic device that concentrates a polychromatic beam of diverging x-rays into a less divergent, parallel, or focused x-ray beam. The device consists of multiple, thin film multilayer stacks. X-rays incident on a given multilayer stack propagate within a high refractive index transmission layer while undergoing multiple total internal reflections from a novel, engineered multilayer containing materials of lower refractive index. Development of this device could lead to order-of-magnitude flux density increases, over a large broadband energy range from below 20 keV to above 300 keV. In this paper, we give an overview of the device and present GE's progress towards fabricating prototype devices.