WorldWideScience

Sample records for atomic force microscopy-based

  1. Atomic Force Microscopy Based Cell Shape Index

    Science.gov (United States)

    Adia-Nimuwa, Usienemfon; Mujdat Tiryaki, Volkan; Hartz, Steven; Xie, Kan; Ayres, Virginia

    2013-03-01

    Stellation is a measure of cell physiology and pathology for several cell groups including neural, liver and pancreatic cells. In the present work, we compare the results of a conventional two-dimensional shape index study of both atomic force microscopy (AFM) and fluorescent microscopy images with the results obtained using a new three-dimensional AFM-based shape index similar to sphericity index. The stellation of astrocytes is investigated on nanofibrillar scaffolds composed of electrospun polyamide nanofibers that has demonstrated promise for central nervous system (CNS) repair. Recent work by our group has given us the ability to clearly segment the cells from nanofibrillar scaffolds in AFM images. The clear-featured AFM images indicated that the astrocyte processes were longer than previously identified at 24h. It was furthermore shown that cell spreading could vary significantly as a function of environmental parameters, and that AFM images could record these variations. The new three-dimensional AFM-based shape index incorporates the new information: longer stellate processes and cell spreading. The support of NSF PHY-095776 is acknowledged.

  2. Atomic force microscopy-based shape analysis of heart mitochondria.

    Science.gov (United States)

    Lee, Gi-Ja; Park, Hun-Kuk

    2015-01-01

    Atomic force microscopy (AFM) has become an important medical and biological tool for the noninvasive imaging of cells and biomaterials in medical, biological, and biophysical research. The major advantages of AFM over conventional optical and electron microscopes for bio-imaging include the facts that no special coating is required and that imaging can be done in all environments-air, vacuum, or aqueous conditions. In addition, it can also precisely determine pico-nano Newton force interactions between the probe tip and the sample surface from force-distance curve measurements.It is widely known that mitochondrial swelling is one of the most important indicators of the opening of the mitochondrial permeability transition (MPT) pore. As mitochondrial swelling is an ultrastructural change, quantitative analysis of this change requires high-resolution microscopic methods such as AFM. Here, we describe the use of AFM-based shape analysis for the characterization of nanostructural changes in heart mitochondria resulting from myocardial ischemia-reperfusion injury. PMID:25634291

  3. Atomic force microscopy based nanoindentation study of onion abaxial epidermis walls in aqueous environment

    Science.gov (United States)

    Xi, Xiaoning; Kim, Seong H.; Tittmann, Bernhard

    2015-01-01

    An atomic force microscopy based nanoindentation method was employed to study how the structure of cellulose microfibril packing and matrix polymers affect elastic modulus of fully hydrated primary plant cell walls. The isolated, single-layered abaxial epidermis cell wall of an onion bulb was used as a test system since the cellulose microfibril packing in this cell wall is known to vary systematically from inside to outside scales and the most abundant matrix polymer, pectin, can easily be altered through simple chemical treatments such as ethylenediaminetetraacetic acid and calcium ions. Experimental results showed that the pectin network variation has significant impacts on the cell wall modulus, and not the cellulose microfibril packing.

  4. Atomic force microscopy based nanoindentation study of onion abaxial epidermis walls in aqueous environment

    International Nuclear Information System (INIS)

    An atomic force microscopy based nanoindentation method was employed to study how the structure of cellulose microfibril packing and matrix polymers affect elastic modulus of fully hydrated primary plant cell walls. The isolated, single-layered abaxial epidermis cell wall of an onion bulb was used as a test system since the cellulose microfibril packing in this cell wall is known to vary systematically from inside to outside scales and the most abundant matrix polymer, pectin, can easily be altered through simple chemical treatments such as ethylenediaminetetraacetic acid and calcium ions. Experimental results showed that the pectin network variation has significant impacts on the cell wall modulus, and not the cellulose microfibril packing

  5. Atomic force microscopy based nanoindentation study of onion abaxial epidermis walls in aqueous environment

    Energy Technology Data Exchange (ETDEWEB)

    Xi, Xiaoning; Tittmann, Bernhard [Department of Engineering Science and Mechanics, Pennsylvania State University, University Park, Pennsylvania 16802 (United States); Kim, Seong H. [Department of Chemical Engineering, Pennsylvania State University, University Park, Pennsylvania 16802 (United States)

    2015-01-14

    An atomic force microscopy based nanoindentation method was employed to study how the structure of cellulose microfibril packing and matrix polymers affect elastic modulus of fully hydrated primary plant cell walls. The isolated, single-layered abaxial epidermis cell wall of an onion bulb was used as a test system since the cellulose microfibril packing in this cell wall is known to vary systematically from inside to outside scales and the most abundant matrix polymer, pectin, can easily be altered through simple chemical treatments such as ethylenediaminetetraacetic acid and calcium ions. Experimental results showed that the pectin network variation has significant impacts on the cell wall modulus, and not the cellulose microfibril packing.

  6. Current status and perspectives in atomic force microscopy-based identification of cellular transformation

    Science.gov (United States)

    Dong, Chenbo; Hu, Xiao; Dinu, Cerasela Zoica

    2016-01-01

    Understanding the complex interplay between cells and their biomechanics and how the interplay is influenced by the extracellular microenvironment, as well as how the transforming potential of a tissue from a benign to a cancerous one is related to the dynamics of both the cell and its surroundings, holds promise for the development of targeted translational therapies. This review provides a comprehensive overview of atomic force microscopy-based technology and its applications for identification of cellular progression to a cancerous phenotype. The review also offers insights into the advancements that are required for the next user-controlled tool to allow for the identification of early cell transformation and thus potentially lead to improved therapeutic outcomes. PMID:27274238

  7. Probing biofouling resistant polymer brush surfaces by atomic force microscopy based force spectroscopy.

    Science.gov (United States)

    Schön, Peter; Kutnyanszky, Edit; ten Donkelaar, Bas; Santonicola, M Gabriella; Tecim, Tugba; Aldred, Nick; Clare, Anthony S; Vancso, G Julius

    2013-02-01

    The protein repellency and biofouling resistance of zwitterionic poly(sulfobetaine methacrylate)(pSBMA) brushes grafted via surface initiated polymerization (SIP) from silicon and glass substrata was assessed using atomic force microscopy (AFM) adherence experiments. Laboratory settlement assays were conducted with cypris larvae of the barnacle Balanus amphitrite. AFM adherence includes the determination of contact rupture forces when AFM probe tips are withdrawn from the substratum. When the surface of the AFM tip is modified, adherence can be assessed with chemical specifity using a method known as chemical force microscopy (CFM). In this study, AFM tips were chemically functionalized with (a) fibronectin- here used as model for a nonspecifically adhering protein - and (b) arginine-glycine-aspartic acid (RGD) peptide motifs covalently attached to poly(methacrylic acid) (PMAA) brushes as biomimics of cellular adhesion receptors. Fibronectin functionalized tips showed significantly reduced nonspecific adhesion to pSBMA-modified substrata compared to bare gold (2.3±0.75 nN) and octadecanethiol (ODT) self-assembled monolayers (1.3±0.75 nN). PMAA and PMAA-RGD modified probes showed no significant adhesion to pSBMA modified silicon substrata. The results gathered through AFM protein adherence studies were complemented by laboratory fouling studies, which showed no adhesion of cypris larvae of Balanus amphitrite on pSBMA. With regard to its unusually high non-specific adsorption to a wide variety of materials the behavior of fibronectin is analogous to the barnacle cyprid temporary adhesive that also binds well to surfaces differing in polarity, charge and free energy. The antifouling efficacy of pSBMA may, therefore, be directly related to the ability of this surface to resist nonspecific protein adsorption. PMID:23138001

  8. The Influence of Physical and Physiological Cues on Atomic Force Microscopy-Based Cell Stiffness Assessment

    OpenAIRE

    Yu-Wei Chiou; Hsiu-Kuan Lin; Ming-Jer Tang; Hsi-Hui Lin; Ming-Long Yeh

    2013-01-01

    Atomic force microscopy provides a novel technique for differentiating the mechanical properties of various cell types. Cell elasticity is abundantly used to represent the structural strength of cells in different conditions. In this study, we are interested in whether physical or physiological cues affect cell elasticity in Atomic force microscopy (AFM)-based assessments. The physical cues include the geometry of the AFM tips, the indenting force and the operating temperature of the AFM. All...

  9. Atomic force microscopy-based repeated machining theory for nanochannels on silicon oxide surfaces

    Energy Technology Data Exchange (ETDEWEB)

    Wang, Z.Q., E-mail: wangzhiqian@sia.cn [State Key Laboratory of Robotics, Shenyang Institute of Automation, CAS, Shenyang 110016 (China); Graduate University of the Chinese Academy of Sciences, Beijing 100049 (China); Jiao, N.D. [State Key Laboratory of Robotics, Shenyang Institute of Automation, CAS, Shenyang 110016 (China); Tung, S. [Department of Mechanical Engineering, University of Arkansas, Fayetteville, AR 72701 (United States); Dong, Z.L. [State Key Laboratory of Robotics, Shenyang Institute of Automation, CAS, Shenyang 110016 (China)

    2011-02-01

    The atomic force microscopy (AFM)-based repeated nanomachining of nanochannels on silicon oxide surfaces is investigated both theoretically and experimentally. The relationships of the initial nanochannel depth vs. final nanochannel depth at a normal force are systematically studied. Using the derived theory and simulation results, the final nanochannel depth can be predicted easily. Meanwhile, if a nanochannel with an expected depth needs to be machined, a right normal force can be selected simply and easily in order to decrease the wear of the AFM tip. The theoretical analysis and simulation results can be effectively used for AFM-based fabrication of nanochannels.

  10. Atomic force microscopy-based repeated machining theory for nanochannels on silicon oxide surfaces

    International Nuclear Information System (INIS)

    The atomic force microscopy (AFM)-based repeated nanomachining of nanochannels on silicon oxide surfaces is investigated both theoretically and experimentally. The relationships of the initial nanochannel depth vs. final nanochannel depth at a normal force are systematically studied. Using the derived theory and simulation results, the final nanochannel depth can be predicted easily. Meanwhile, if a nanochannel with an expected depth needs to be machined, a right normal force can be selected simply and easily in order to decrease the wear of the AFM tip. The theoretical analysis and simulation results can be effectively used for AFM-based fabrication of nanochannels.

  11. Atomic Force Microscopy Based Nanorobotics Modelling, Simulation, Setup Building and Experiments

    CERN Document Server

    Xie, Hui; Régnier, Stéphane; Sitti, Metin

    2012-01-01

    The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s. There have been many progress on modeling, imaging, teleoperated or automated control, human-machine interfacing, instrumentation, and applications of AFM based nanorobotic manipulation systems in literature. This book aims to include all of such state-of-the-art progress in an organized, structured, and detailed manner as a reference book and also potentially a textbook in nanorobotics and any other nanoscale dynamics, systems and controls related research and education. Clearly written and well-organized, this text introduces designs and prototypes of the nanorobotic systems in detail with innovative principles of three-dimensional manipulation force microscopy and parallel imaging/manipulation force microscopy.

  12. The influence of physical and physiological cues on atomic force microscopy-based cell stiffness assessment.

    Directory of Open Access Journals (Sweden)

    Yu-Wei Chiou

    Full Text Available Atomic force microscopy provides a novel technique for differentiating the mechanical properties of various cell types. Cell elasticity is abundantly used to represent the structural strength of cells in different conditions. In this study, we are interested in whether physical or physiological cues affect cell elasticity in Atomic force microscopy (AFM-based assessments. The physical cues include the geometry of the AFM tips, the indenting force and the operating temperature of the AFM. All of these cues show a significant influence on the cell elasticity assessment. Sharp AFM tips create a two-fold increase in the value of the effective Young's modulus (E(eff relative to that of the blunt tips. Higher indenting force at the same loading rate generates higher estimated cell elasticity. Increasing the operation temperature of the AFM leads to decreases in the cell stiffness because the structure of actin filaments becomes disorganized. The physiological cues include the presence of fetal bovine serum or extracellular matrix-coated surfaces, the culture passage number, and the culture density. Both fetal bovine serum and the extracellular matrix are critical for cells to maintain the integrity of actin filaments and consequently exhibit higher elasticity. Unlike primary cells, mouse kidney progenitor cells can be passaged and maintain their morphology and elasticity for a very long period without a senescence phenotype. Finally, cell elasticity increases with increasing culture density only in MDCK epithelial cells. In summary, for researchers who use AFM to assess cell elasticity, our results provide basic and significant information about the suitable selection of physical and physiological cues.

  13. Experimental validation of atomic force microscopy-based cell elasticity measurements

    Science.gov (United States)

    Harris, Andrew R.; Charras, G. T.

    2011-08-01

    Atomic force microscopy (AFM) is widely used for measuring the elasticity of living cells yielding values ranging from 100 Pa to 100 kPa, much larger than those obtained using bead-tracking microrheology or micropipette aspiration (100-500 Pa). AFM elasticity measurements appear dependent on tip geometry with pyramidal tips yielding elasticities 2-3 fold larger than spherical tips, an effect generally attributed to the larger contact area of spherical tips. In AFM elasticity measurements, experimental force-indentation curves are analyzed using contact mechanics models that infer the tip-cell contact area from the tip geometry and indentation depth. The validity of these assumptions has never been verified. Here we utilize combined AFM-confocal microscopy of epithelial cells expressing a GFP-tagged membrane marker to directly characterize the indentation geometry and measure the indentation depth. Comparison with data derived from AFM force-indentation curves showed that the experimentally measured contact area for spherical tips agrees well with predicted values, whereas for pyramidal tips, the contact area can be grossly underestimated at forces larger than ~ 0.2 nN leading to a greater than two-fold overestimation of elasticity. These data suggest that a re-examination of absolute cellular elasticities reported in the literature may be necessary and we suggest guidelines for avoiding elasticity measurement artefacts introduced by extraneous cantilever-cell contact.

  14. Experimental validation of atomic force microscopy-based cell elasticity measurements

    Energy Technology Data Exchange (ETDEWEB)

    Harris, Andrew R; Charras, G T, E-mail: g.charras@ucl.ac.uk [London Centre for Nanotechnology, University College London, London WC1H 0AH (United Kingdom)

    2011-08-26

    Atomic force microscopy (AFM) is widely used for measuring the elasticity of living cells yielding values ranging from 100 Pa to 100 kPa, much larger than those obtained using bead-tracking microrheology or micropipette aspiration (100-500 Pa). AFM elasticity measurements appear dependent on tip geometry with pyramidal tips yielding elasticities 2-3 fold larger than spherical tips, an effect generally attributed to the larger contact area of spherical tips. In AFM elasticity measurements, experimental force-indentation curves are analyzed using contact mechanics models that infer the tip-cell contact area from the tip geometry and indentation depth. The validity of these assumptions has never been verified. Here we utilize combined AFM-confocal microscopy of epithelial cells expressing a GFP-tagged membrane marker to directly characterize the indentation geometry and measure the indentation depth. Comparison with data derived from AFM force-indentation curves showed that the experimentally measured contact area for spherical tips agrees well with predicted values, whereas for pyramidal tips, the contact area can be grossly underestimated at forces larger than {approx} 0.2 nN leading to a greater than two-fold overestimation of elasticity. These data suggest that a re-examination of absolute cellular elasticities reported in the literature may be necessary and we suggest guidelines for avoiding elasticity measurement artefacts introduced by extraneous cantilever-cell contact.

  15. Measuring the loss tangent of polymer materials with atomic force microscopy based methods

    International Nuclear Information System (INIS)

    Atomic force microscopy (AFM) quantitatively maps viscoelastic parameters of polymers on the nanoscale by several methods. The loss tangent, the ratio between dissipated and stored energy, was measured on a blend of thermoplastic polymer materials by a dynamic contact method, contact resonance, and by a recently developed loss tangent measurement by amplitude modulation AFM. Contact resonance measurements were performed both with dual AC resonance tracking and band excitation (BE), allowing for a reference-free measurement of the loss tangent. Amplitude modulation AFM was performed where a recent interpretation of the phase signal under certain operating conditions allows for the loss tangent to be calculated. The loss tangent measurements were compared with values expected from time–temperature superposed frequency-dependent dynamical mechanical curves of materials and reveal that the loss tangents determined from the BE contact resonance method provide the most accurate values. (paper)

  16. Mapping of Proteomic Composition on the Surfaces of Bacillus spores by Atomic Force Microscopy-based Immunolabeling

    Energy Technology Data Exchange (ETDEWEB)

    Plomp, M; Malkin, A J

    2008-06-02

    Atomic force microscopy provides a unique capability to image high-resolution architecture and structural dynamics of pathogens (e.g. viruses, bacteria and bacterial spores) at near molecular resolution in native conditions. Further development of atomic force microscopy in order to enable the correlation of pathogen protein surface structures with specific gene products is essential to understand the mechanisms of the pathogen life cycle. We have applied an AFM-based immunolabeling technique for the proteomic mapping of macromolecular structures through the visualization of the binding of antibodies, conjugated with nanogold particles, to specific epitopes on Bacillus spore surfaces. This information is generated while simultaneously acquiring the surface morphology of the pathogen. The immunospecificity of this labeling method was established through the utilization of specific polyclonal and monoclonal antibodies that target spore coat and exosporium epitopes of Bacillus atrophaeus and Bacillus anthracis spores.

  17. Atomic force microscopy-based antibody recognition imaging of proteins in the pathological deposits in Pseudoexfoliation Syndrome

    International Nuclear Information System (INIS)

    The phenomenon of protein aggregation is of considerable interest to various disciplines, including the field of medicine. A range of disease pathologies are associated with this phenomenon. One of the ocular diseases hallmarked by protein aggregation is the Pseudoexfoliation (PEX) Syndrome. This condition is characterized by the deposition of insoluble proteinaceous material on the anterior human lens capsule. Genomic and proteomic analyses have revealed an association of specific genetic markers and various proteins, respectively, with PEX syndrome. However, the ultrastructure of the protein aggregates is poorly characterized. This study seeks to build capacity to determine the molecular nature of PEX aggregates on human lens capsules in their native state by AFM-based antibody recognition imaging. Lysyl oxidase-Like 1 (LOXL1), a protein identified as a component of PEX aggregates, is detected by an antibody-modified AFM probe. Topographical AFM images and antibody recognition images are obtained using three AFM-based techniques: TREC, phase and force-volume imaging. LOXL1 is found to be present on the lens capsule surface, and is localized around fibrous protein aggregates. Our evaluation shows that TREC imaging is best suited for human tissue imaging and holds significant potential for imaging of human disease tissues in their native state. -- Highlights: → Atomic force microscopy techniques were applied to diseased human tissues. → LOXL1 protein was detected on the small fibers of Pseudoexfoliation deposits. → PicoTREC was the optimum technique for investigating protein aggregates.

  18. Highly reliable and efficient atomic force microscopy based bending test for assessing Young's modulus of one-dimensional nanomaterials

    Science.gov (United States)

    Gao, Yao; Sun, Yi-Jing; Zhang, Tong-Yi

    2016-03-01

    A highly reliable and efficient mechanical characterization technique for one-dimensional nanomaterials was developed based on multi-position bending tests by atomic force microscope (AFM) on top-down fabricated suspended nanowires with double-clamped ends and appropriate theoretical analysis considering residual stress and substrate deformation. The reliability and efficiency of the technique were improved through the avoidance of sample manipulation, high sample comparability, precise experimental control, and more data for mechanics analysis. The AFM-based multi-position bending tests were conducted on gold nanowires with thicknesses of ˜90 nm, widths ranged from 180 nm to 340 nm, and suspension lengths ranged from 3.6 μm to 5.1 μm, showing good testing repeatability and data reliability. The evaluated Young's modulus for gold nanowires was 75.35 ± 6.60 GPa, which had a much smaller deviation compared to that of 72.06 ± 16.21 GPa reported in the literature.

  19. Interaction force microscopy based on quartz tuning fork force sensor

    Science.gov (United States)

    Qin, Yexian

    The ability to sense small changes in the interaction force between a scanning probe microscope (SPM) tip and a substrate requires cantilevers with a sharp mechanical resonance. A typical commercially available cantilever in air is characterized by a resonance with a Q factor of 100 ˜ 300. The low Q factor can be attributed to imperfections in the cantilever itself as well as damping effects of the surrounding air. To substantially increase the Q factor, novel concepts are required. For this reason, we have performed a systematic study of quartz tuning fork resonators for possible use with SPMs. We find that tuning fork resonators operating in air are characterized by Q factors in the order of 104, thereby greatly improving the SPM's ability to measure small shifts in the interaction force. By carefully attaching commercially available SPM tips to the tuning fork, it is possible to obtain SPM images using non-contact imaging techniques and analyze the tip-sample interactions. The assembly of uniform molecular monolayers on atomically flat substrates for molecular electronics applications has received widespread attention during the past ten years. Scanning probe techniques are often used to assess substrate topography, molecular ordering and electronic properties, yet little is known about the fundamental tip-molecule interaction. To address this issue we have built an Interaction Force Microscope using a quartz tuning fork to probe tip-molecular monolayer interactions using scanning probe microscopy. The high quality factor and stable resonant frequency of a quartz tuning fork allows accurate measurement of small shifts in the resonant frequency as the tip interacts with the substrate. To permit an accurate measure of surface interaction forces, the electrical and piezomechanical properties of a tuning fork have been calibrated using a fiber optical interferometer. In prior work [1], we have studied molecular layers formed from either 4-Trifluoro

  20. Noncontact scanning force microscopy based on a modified tuning fork sensor

    Science.gov (United States)

    Göttlich, Hagen; Stark, Robert W.; Pedarnig, Johannes D.; Heckl, Wolfgang M.

    2000-08-01

    Distance control using a tuning fork setup for the detection of shear forces is a standard configuration in scanning near-field optical microscopy (SNOM). Based on this concept, a modified sensor was developed, where a standard silicon tip for atomic force microscopy (AFM) is attached to the front end of one prong of a 100 kHz quartz tuning fork oscillator. Comparison of force curves of a standard tapping-mode AFM cantilever, a conventional fiber tip SNOM sensor and the novel AFM tip shear force sensor demonstrate an enhanced stability and sensitivity of the new sensor. Due to the rigid sensor design the force curves of the AFM tip shear force sensor indicate a perfect noncontact behavior under normal conditions in air. Noncontact images show a comparable resolution to conventional force microscopy.

  1. Atomic Force Microscope

    Energy Technology Data Exchange (ETDEWEB)

    Day, R.D.; Russell, P.E.

    1988-12-01

    The Atomic Force Microscope (AFM) is a recently developed instrument that has achieved atomic resolution imaging of both conducting and non- conducting surfaces. Because the AFM is in the early stages of development, and because of the difficulty of building the instrument, it is currently in use in fewer than ten laboratories worldwide. It promises to be a valuable tool for obtaining information about engineering surfaces and aiding the .study of precision fabrication processes. This paper gives an overview of AFM technology and presents plans to build an instrument designed to look at engineering surfaces.

  2. Single atom measurement and atomic manipulation using atomic force microscope

    International Nuclear Information System (INIS)

    This paper explains studies to measure atomic force as the force linking an atom and atom, using an atomic force microscope (AFM). First, it describes the principle and device configuration of AFM, and as an example of the atomic force measurement of Si atoms on the surface of Si(111)-(7x7), it describes the technique to measure atomic force using AFM, as well as the uncertainty of probe tip against atomic force. In addition, it describes the following items on the measurement results of chemical bonding force: (1) chemical bonding force vs physical force and chemical bonding force vs current on the surface of Si(111)-(7x7), (2) chemical bonding force and element dependence on the surface of Si/Sn(111)-(√3x√3), (3) atomic manipulation based on AMF, and (4) relationship between atomic manipulation and the size of chemical bonding force with a probe. (A.O.)

  3. Atom location using scanning transmission electron microscopy based on electron energy loss spectroscopy

    International Nuclear Information System (INIS)

    Full text: The technique of atom location by channelling enhanced microanalysis (ALCHEMI) using cross section data, measured as a function of electron beam orientation, has been widely implemented by many researchers. The accurate application of ALCHEMI, usually based on energy dispersive x-ray analysis (EDX), requires knowledge, from first principles, of the relative delocalization of the inner-shell ionization interaction (see for example Oxley and Allen, 1998; Oxley et al., 1999). Scanning transmission electron microscopy (STEM) based on electron energy loss spectroscopy (EELS) also provides information about the location of atoms of different types within the crystal lattice. Unlike high angle annular dark field (HAADF), EELS provides a unique signal for each atom type. In conjunction with highly focused probes, allowing near atomic resolution, this makes possible, in principle, the application of ALCHEMI like techniques to STEM images to determine the distribution of impurities within the unit cell. The accurate interpretation of STEM results requires that both the inner-shell ionization interaction and resulting ionization cross section or image be correctly modelled. We present model calculations demonstrating the in principle application of ALCHEMI type techniques to STEM images pertinent to EELS. The inner-shell ionisation interaction is modelled using Hartree-Fock wave functions to describe the atomic bound states and Hartree-Slater wave functions to describe the continuum states. The wave function within the crystal is calculated using boundary conditions appropriate for a highly focussed probe (Rossouw and Allen, 2001) and STEM images or ionisation cross sections are simulated using an inelastic cross section formulation that correctly accounts for the contribution from both dynamical electrons and those dechannelled by absorptive scattering processes such as thermal diffuse scattering (TDS). Copyright (2002) Australian Society for Electron Microscopy

  4. Advanced atomic force microscopy techniques

    OpenAIRE

    Thilo Glatzel; Hendrik Hölscher; Thomas Schimmel; Baykara, Mehmet Z; Schwarz, Udo D.; Ricardo Garcia

    2012-01-01

    Although its conceptual approach is as simple as the technique used in record players already introduced in the 19th century, the invention of the atomic force microscope (AFM) in 1986 by Binnig, Quate, and Gerber was a milestone for nanotechnology. The scanning tunneling microscope (STM), introduced some years earlier, had already achieved atomic resolution, but is limited to conductive surfaces. Since its operational principle is based on the detection of the forces acting between tip and s...

  5. Coaxial Atomic Force Microscope Tweezers

    CERN Document Server

    Brown, K A; Westervelt, R M

    2010-01-01

    We demonstrate coaxial atomic force microscope (AFM) tweezers that can trap and place small objects using dielectrophoresis (DEP). An attractive force is generated at the tip of a coaxial AFM probe by applying a radio frequency voltage between the center conductor and a grounded shield; the origin of the force is found to be DEP by measuring the pull-off force vs. applied voltage. We show that the coaxial AFM tweezers (CAT) can perform three dimensional assembly by picking up a specified silica microsphere, imaging with the microsphere at the end of the tip, and placing it at a target destination.

  6. Coaxial atomic force microscope tweezers

    Science.gov (United States)

    Brown, K. A.; Aguilar, J. A.; Westervelt, R. M.

    2010-03-01

    We demonstrate coaxial atomic force microscope (AFM) tweezers that can trap and place small objects using dielectrophoresis (DEP). An attractive force is generated at the tip of a coaxial AFM probe by applying a radio frequency voltage between the center conductor and a grounded shield; the origin of the force is found to be DEP by measuring the pull-off force versus applied voltage. We show that the coaxial AFM tweezers can perform three-dimensional assembly by picking up a specified silica microsphere, imaging with the microsphere at the end of the tip, and placing it at a target destination.

  7. Coffee Cup Atomic Force Microscopy

    Science.gov (United States)

    Ashkenaz, David E.; Hall, W. Paige; Haynes, Christy L.; Hicks, Erin M.; McFarland, Adam D.; Sherry, Leif J.; Stuart, Douglas A.; Wheeler, Korin E.; Yonzon, Chanda R.; Zhao, Jing; Godwin, Hilary A.; Van Duyne, Richard P.

    2010-01-01

    In this activity, students use a model created from a coffee cup or cardstock cutout to explore the working principle of an atomic force microscope (AFM). Students manipulate a model of an AFM, using it to examine various objects to retrieve topographic data and then graph and interpret results. The students observe that movement of the AFM…

  8. Dynamic atomic force microscopy methods

    Science.gov (United States)

    García, Ricardo; Pérez, Rubén

    2002-09-01

    In this report we review the fundamentals, applications and future tendencies of dynamic atomic force microscopy (AFM) methods. Our focus is on understanding why the changes observed in the dynamic properties of a vibrating tip that interacts with a surface make possible to obtain molecular resolution images of membrane proteins in aqueous solutions or to resolve atomic-scale surface defects in ultra high vacuum (UHV). Our description of the two major dynamic AFM modes, amplitude modulation atomic force microscopy (AM-AFM) and frequency modulation atomic force microscopy (FM-AFM) emphasises their common points without ignoring the differences in experimental set-ups and operating conditions. Those differences are introduced by the different feedback parameters, oscillation amplitude in AM-AFM and frequency shift and excitation amplitude in FM-AFM, used to track the topography and composition of a surface. The theoretical analysis of AM-AFM (also known as tapping-mode) emphasises the coexistence, in many situations of interests, of two stable oscillation states, a low and high amplitude solution. The coexistence of those oscillation states is a consequence of the presence of attractive and repulsive components in the interaction force and their non-linear dependence on the tip-surface separation. We show that key relevant experimental properties such as the lateral resolution, image contrast and sample deformation are highly dependent on the oscillation state chosen to operate the instrument. AM-AFM allows to obtain simultaneous topographic and compositional contrast in heterogeneous samples by recording the phase angle difference between the external excitation and the tip motion (phase imaging). Significant applications of AM-AFM such as high-resolution imaging of biomolecules and polymers, large-scale patterning of silicon surfaces, manipulation of single nanoparticles or the fabrication of single electron devices are also reviewed. FM-AFM (also called non

  9. Noncontact atomic force microscopy v.3

    CERN Document Server

    Morita, Seizo; Meyer, Ernst

    2015-01-01

    This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combine

  10. Nanorheology by atomic force microscopy.

    Science.gov (United States)

    Li, Tai-De; Chiu, Hsiang-Chih; Ortiz-Young, Deborah; Riedo, Elisa

    2014-12-01

    We present an Atomic Force Microscopy (AFM) based method to investigate the rheological properties of liquids confined within a nanosize gap formed by an AFM tip apex and a solid substrate. In this method, a conventional AFM cantilever is sheared parallel to a substrate surface by means of a lock-in amplifier while it is approaching and retracting from the substrate in liquid. The normal solvation forces and lateral viscoelastic shear forces experienced by the AFM tip in liquid can be simultaneously measured as a function of the tip-substrate distance with sub-nanometer vertical resolution. A new calibration method is applied to compensate for the linear drift of the piezo transducer and substrate system, leading to a more precise determination of the tip-substrate distance. By monitoring the phase lag between the driving signal and the cantilever response in liquid, the frequency dependent viscoelastic properties of the confined liquid can also be derived. Finally, we discuss the results obtained with this technique from different liquid-solid interfaces. Namely, octamethylcyclotetrasiloxane and water on mica and highly oriented pyrolytic graphite. PMID:25554301

  11. Probing The Atomic Higgs Force

    CERN Document Server

    Delaunay, Cédric; Perez, Gilad; Soreq, Yotam

    2016-01-01

    We propose an approach to probe Higgs boson couplings to the building blocks of matter: the electron and the up and down quarks, with precision measurement of isotope shifts in atomic clock transitions. We show that the attractive Higgs force between nuclei and their bound electrons induces measurable non-linearities in a King plot of two isotope shifts. We present an experimental method which, given state-of-the-art accuracy in frequency comparison, competes with and potentially surpasses the Large Hadron Collider in bounding the Higgs-to-light-fermion couplings. Better knowledge of the latter is an important test of the Standard Model which could lead, besides the establishment of new physics above the weak scale, to an alternative understanding of the flavor puzzle.

  12. Polynomial force approximations and multifrequency atomic force microscopy

    OpenAIRE

    Daniel Platz; Daniel Forchheimer; Tholén, Erik A; David B. Haviland

    2013-01-01

    We present polynomial force reconstruction from experimental intermodulation atomic force microscopy (ImAFM) data. We study the tip–surface force during a slow surface approach and compare the results with amplitude-dependence force spectroscopy (ADFS). Based on polynomial force reconstruction we generate high-resolution surface-property maps of polymer blend samples. The polynomial method is described as a special example of a more general approximative force reconstruction, where the aim is...

  13. Atomic Force Microscope Mediated Chromatography

    Science.gov (United States)

    Anderson, Mark S.

    2013-01-01

    The atomic force microscope (AFM) is used to inject a sample, provide shear-driven liquid flow over a functionalized substrate, and detect separated components. This is demonstrated using lipophilic dyes and normal phase chromatography. A significant reduction in both size and separation time scales is achieved with a 25-micron-length column scale, and one-second separation times. The approach has general applications to trace chemical and microfluidic analysis. The AFM is now a common tool for ultra-microscopy and nanotechnology. It has also been demonstrated to provide a number of microfluidic functions necessary for miniaturized chromatography. These include injection of sub-femtoliter samples, fluidic switching, and sheardriven pumping. The AFM probe tip can be used to selectively remove surface layers for subsequent microchemical analysis using infrared and tip-enhanced Raman spectroscopy. With its ability to image individual atoms, the AFM is a remarkably sensitive detector that can be used to detect separated components. These diverse functional components of microfluidic manipulation have been combined in this work to demonstrate AFM mediated chromatography. AFM mediated chromatography uses channel-less, shear-driven pumping. This is demonstrated with a thin, aluminum oxide substrate and a non-polar solvent system to separate a mixture of lipophilic dyes. In conventional chromatographic terms, this is analogous to thin-layer chromatography using normal phase alumina substrate with sheardriven pumping provided by the AFM tip-cantilever mechanism. The AFM detection of separated components is accomplished by exploiting the variation in the localized friction of the separated components. The AFM tip-cantilever provides the mechanism for producing shear-induced flows and rapid pumping. Shear-driven chromatography (SDC) is a relatively new concept that overcomes the speed and miniaturization limitations of conventional liquid chromatography. SDC is based on a

  14. Casimir-Polder forces on moving atoms

    International Nuclear Information System (INIS)

    Polarizable atoms and molecules experience the Casimir-Polder force near magnetoelectric bodies, a force that is induced by quantum fluctuations of the electromagnetic field and the matter. Atoms and molecules in relative motion to a magnetoelectric surface experience an additional velocity-dependent force. We present a full quantum-mechanical treatment of this force and identify a generalized Doppler effect, the time delay between photon emission and reabsorption, and the Roentgen interaction as its three sources. For ground-state atoms, the force is very small and always decelerating, hence commonly known as quantum friction. For atoms and molecules in electronically excited states, on the contrary, both decelerating and accelerating forces can occur depending on the magnitude of the atomic transition frequency relative to the surface-plasmon frequency.

  15. Introduction to light forces, atom cooling, and atom trapping

    OpenAIRE

    Savage, Craig

    1995-01-01

    This paper introduces and reviews light forces, atom cooling and atom trapping. The emphasis is on the physics of the basic processes. In discussing conservative forces the semi-classical dressed states are used rather than the usual quantized field dressed states.

  16. Elasticity Maps of Living Neurons Measured by Combined Fluorescence and Atomic Force Microscopy

    OpenAIRE

    Spedden, Elise; White, James D.; Naumova, Elena N.; Kaplan, David L.; Staii, Cristian

    2013-01-01

    Detailed knowledge of mechanical parameters such as cell elasticity, stiffness of the growth substrate, or traction stresses generated during axonal extensions is essential for understanding the mechanisms that control neuronal growth. Here, we combine atomic force microscopy-based force spectroscopy with fluorescence microscopy to produce systematic, high-resolution elasticity maps for three different types of live neuronal cells: cortical (embryonic rat), embryonic chick dorsal root ganglio...

  17. Long range intermolecular forces in triatomic systems: connecting the atom-diatom and atom-atom-atom representations

    OpenAIRE

    Cvitas, Marko T.; Soldan, Pavel; Hutson, Jeremy M.

    2005-01-01

    The long-range forces that act between three atoms are analysed in both atom-diatom and atom-atom-atom representations. Expressions for atom-diatom dispersion coefficients are obtained in terms of 3-body nonadditive coefficients. The anisotropy of atom-diatom C_6 dispersion coefficients arises primarily from nonadditive triple-dipole and quadruple-dipole forces, while pairwise-additive forces and nonadditive triple-dipole and dipole-dipole-quadrupole forces contribute significantly to atom-di...

  18. Imaging spectroscopy with the atomic force microscope

    OpenAIRE

    Baselt, David R.; Baldeschwieler, John D.

    1994-01-01

    Force curve imaging spectroscopy involves acquiring a force-distance curve at each pixel of an atomic force microscope image. Processing of the resulting data yields images of sample hardness and tip-sample adhesion. These images resemble Z modulation images and the sum of forward and reverse friction images, respectively, and like them exhibit a number of potentially misleading contrast mechanisms. In particular, XY tip motion has a pronounced effect on hardness images and the meniscus force...

  19. Electrostatic interaction in atomic force microscopy

    OpenAIRE

    Butt, Hans-Jüurgen

    1991-01-01

    In atomic force microscopy, the stylus experiences an electrostatic force when imaging in aqueous medium above a charged surface. This force has been calculated numerically with continuum theory for a silicon nitrite or silicon oxide stylus. For comparison, the Van der Waals force was also calculated. In contrast to the Van der Waals attraction, the electrostatic force is repulsive. At a distance of 0.5 nm the electrostatic force is typically 10-12-10-10 N and thus comparable in strength to t...

  20. Atomic force microscopy and direct surface force measurements

    NARCIS (Netherlands)

    Ralston, J.; Larson, I.; Rutland, M.; Feiler, A.; Kleijn, J.M.

    2005-01-01

    The atomic force microscope (AFM) is designed to provide high-resolution (in the ideal case, atomic) topographical analysis, applicable to both conducting and nonconducting surfaces. The basic imaging principle is very simple: a sample attached to a piezoelectric positioner is rastered beneath a sha

  1. Atom inlays performed at room temperature using atomic force microscopy

    Science.gov (United States)

    Sugimoto, Yoshiaki; Abe, Masayuki; Hirayama, Shinji; Oyabu, Noriaki; Custance, Óscar; Morita, Seizo

    2005-02-01

    The ability to manipulate single atoms and molecules laterally for creating artificial structures on surfaces is driving us closer to the ultimate limit of two-dimensional nanoengineering. However, experiments involving this level of manipulation have been performed only at cryogenic temperatures. Scanning tunnelling microscopy has proved, so far, to be a unique tool with all the necessary capabilities for laterally pushing, pulling or sliding single atoms and molecules, and arranging them on a surface at will. Here we demonstrate, for the first time, that it is possible to perform well-controlled lateral manipulations of single atoms using near-contact atomic force microscopy even at room temperature. We report the creation of 'atom inlays', that is, artificial atomic patterns formed from a few embedded atoms in the plane of a surface. At room temperature, such atomic structures remain stable on the surface for relatively long periods of time.

  2. Measuring Forces between Oxide Surfaces Using the Atomic Force Microscope

    DEFF Research Database (Denmark)

    Pedersen, Henrik Guldberg; Høj, Jakob Weiland

    1996-01-01

    The interactions between colloidal particles play a major role in processing of ceramics, especially in casting processes. With the Atomic Force Microscope (AFM) it is possible to measure the inter-action force between a small oxide particle (a few micron) and a surface as function of surface...

  3. Surface forces studied with colloidal probe atomic force microscopy

    OpenAIRE

    Giesbers, M.

    2001-01-01

    Forces between surfaces are a determining factor for the performance of natural as well as synthetic colloidal systems, and play a crucial role in industrial production processes. Measuring these forces is a scientific and experimental challenge and over the years several techniques have been developed to measure the interaction between surfaces directly as a function of their separation distance. Colloidal probe atomic force microscopy (colloidal probe AFM) offers the possibility to study su...

  4. Atomic force microscopy in cell biology

    Institute of Scientific and Technical Information of China (English)

    LU Zhexue; ZHANG Zhiling; PANG Daiwen

    2005-01-01

    The history, characteristic, operation modes and coupling techniques of atomic force microscopy (AFM) are introduced. Then the application in cell biology is reviewed in four aspects: cell immobilization methods, cell imaging, force spectrum study and cell manipulation. And the prospect of AFM application in cell biology is discussed.

  5. Early Stages of the Chemical Vapor Deposition of Pyrolytic Carbon Investigated by Atomic Force Microscopy

    OpenAIRE

    Pfrang, Andreas; WAN Yong-Zhong; Schimmel, Thomas

    2009-01-01

    The early stages of chemical vapor deposition of pyrolytic carbon on planar silicon substrates were studied by the atomic force microscopy-based technique of chemical contrast imaging. Short deposition times were chosen to focus on the early stages of the deposition process, and three different types of nucleation were found: random nucleation of single islands, nucleation of carbon islands along lines and secondary nucleation which corresponds to the nucleation of carbon islands at the edges...

  6. Interfacial forces between silica surfaces measured by atomic force microscopy

    Institute of Scientific and Technical Information of China (English)

    DUAN Jinming

    2009-01-01

    Colloidal particle stability and some other interfacial phenomena are governed by interfacial force interactions. The two well known forces are van der Waals force and electrostatic force, as documented by the classical Derjaguin, Landau, Verwey and Overbeek (DLVO) theory. Moreover, advances in modern instrumentation and colloid science suggested that some short-ranged forces or structure forces are important for relevant colloidal systems. The interfacial and/or molecular forces can be measured as a resultant force as function of separation distance by atomic force microscopy (AFM) colloid probe. This article presents a discussion on AFM colloid probe measurement of silica particle and silica wafer surfaces in solutions with some technical notifications in measurement and data convolution mechanisms. The measured forces are then analyzed and discussed based on the 'constant charge' and 'constant potential' models of DLVO theory. The difference between the prediction of DLVO theory and the measured results indicates that there is a strong short-range structure force between the two hydrophilic surfaces, even at extremely low ionic concentration, such as Milli-Q water purity solution.

  7. Casimir force between atomically thin gold films

    OpenAIRE

    Boström, Mathias; Persson, Clas; Sernelius, Bo E.

    2013-01-01

    We have used density functional theory to calculate the anisotropic dielectric functions for ultrathin gold sheets (composed of 1, 3, 6, and 15 atomic layers). Such films are important components in nano-electromechanical systems. When using correct dielectric functions rather than bulk gold dielectric functions we predict an enhanced attractive Casimir-Lifshitz force (at most around 20%) between two atomically thin gold sheets. For thicker sheets the dielectric properties and the correspondi...

  8. Capillary forces in tapping mode atomic force microscopy

    NARCIS (Netherlands)

    Zitzler, L.; Herminghaus, S.; Mugele, F.

    2002-01-01

    We investigated the influence of the relative humidity on amplitude and phase of the cantilever oscillation while operating an atomic force microscope (AFM) in the tapping mode. If the free oscillation amplitude A0 exceeds a certain critical amplitude Ac, the amplitude- and phase-distance curves sho

  9. Reconstruction of Undersampled Atomic Force Microscopy Images

    DEFF Research Database (Denmark)

    Jensen, Tobias Lindstrøm; Arildsen, Thomas; Østergaard, Jan;

    2013-01-01

    Atomic force microscopy (AFM) is one of the most advanced tools for high-resolution imaging and manipulation of nanoscale matter. Unfortunately, standard AFM imaging requires a timescale on the order of seconds to minutes to acquire an image which makes it complicated to observe dynamic processes...

  10. PLASMID DNA IMAGED BY ATOMIC FORCE MICROSCOPY

    Czech Academy of Sciences Publication Activity Database

    Pachnerová Brabcová, Kateřina; Sihver, L.; Štěpán, Václav; Davídková, Marie

    Vol. 34. Bratislava : SMU - Faculty of Public Health, 2014. s. 125-125. ISBN 978-80-89384-08-2. [XXXVI.Dny radiační ochrany. 10.11.2014-14.11.2014, Poprad] Institutional support: RVO:61389005 Keywords : DNA damage * radiation * atomic force microscopy Subject RIV: BO - Biophysics

  11. Recognizing nitrogen dopant atoms in graphene using atomic force microscopy

    Science.gov (United States)

    van der Heijden, Nadine J.; Smith, Daniël; Calogero, Gaetano; Koster, Rik S.; Vanmaekelbergh, Daniel; van Huis, Marijn A.; Swart, Ingmar

    2016-06-01

    Doping graphene by heteroatoms such as nitrogen presents an attractive route to control the position of the Fermi level in the material. We prepared N-doped graphene on Cu(111) and Ir(111) surfaces via chemical vapor deposition of two different molecules. Using scanning tunneling microscopy images as a benchmark, we show that the position of the dopant atoms can be determined using atomic force microscopy. Specifically, the frequency shift-distance curves Δ f (z ) acquired above a N atom are significantly different from the curves measured over a C atom. Similar behavior was found for N-doped graphene on Cu(111) and Ir(111). The results are corroborated by density functional theory calculations employing a van der Waals functional.

  12. Force Density Balance inside the Hydrogen Atom

    CERN Document Server

    Himpsel, F J

    2015-01-01

    Motivated by the long-debated question about the internal stability of the electron, the force densities acting on the charge density of the 1s electron in the H atom are investigated. The problem is mapped onto the canonical formalism for a classical Dirac field coupled to the electric field of an external point charge. An explicit calculation shows that the attractive Coulomb force density is balanced exactly at every point in space by the repulsive confinement force density. The latter requires evaluating the divergence of the stress tensor for the 1s solution of the Dirac equation. Such a local force balance goes beyond the global stability criteria that are usually given for the H atom. This concept is extended to the internal stability of any charged particle by investigating the force densities acting on its surrounding vacuum polarization. At large distances one has to consider only the charge density of virtual electrons and positrons, induced by a point charge in the vacuum of quantum electrodynamic...

  13. Cell mechanics measured with Atomic force microscopy

    International Nuclear Information System (INIS)

    Full text: In this contribution, I would like to present recent results about cell mechanics obtained with atomic force microscopy and its relation with basic soft matter science. We will present a novel way to obtain viscoelastic properties (Young modulus, relaxation time and viscosity) of breast cancer cells based on stress relaxation and creep measurements. Additionally we will show the influence of applied stress on red blood cell shape. The importance of such type of measurements on soft matter physics, cell biology, and biomedical science. (author)

  14. Periodicity in bimodal atomic force microscopy

    Energy Technology Data Exchange (ETDEWEB)

    Lai, Chia-Yun; Santos, Sergio, E-mail: santos-en@yahoo.com; Chiesa, Matteo [Laboratory for Energy and NanoScience (LENS), Institute Center for Future Energy (iFES), Masdar Institute of Science and Technology, Abu Dhabi (United Arab Emirates); Barcons, Victor [Departament de Disseny i Programació de Sistemes Electrònics, UPC - Universitat Politècnica de Catalunya, Av. Bases, 61, 08242 Manresa (Barcelona) (Spain)

    2015-07-28

    Periodicity is fundamental for quantification and the application of conservation principles of many important systems. Here, we discuss periodicity in the context of bimodal atomic force microscopy (AFM). The relationship between the excited frequencies is shown to affect and control both experimental observables and the main expressions quantified via these observables, i.e., virial and energy transfer expressions, which form the basis of the bimodal AFM theory. The presence of a fundamental frequency further simplifies the theory and leads to close form solutions. Predictions are verified via numerical integration of the equation of motion and experimentally on a mica surface.

  15. Periodicity in bimodal atomic force microscopy

    International Nuclear Information System (INIS)

    Periodicity is fundamental for quantification and the application of conservation principles of many important systems. Here, we discuss periodicity in the context of bimodal atomic force microscopy (AFM). The relationship between the excited frequencies is shown to affect and control both experimental observables and the main expressions quantified via these observables, i.e., virial and energy transfer expressions, which form the basis of the bimodal AFM theory. The presence of a fundamental frequency further simplifies the theory and leads to close form solutions. Predictions are verified via numerical integration of the equation of motion and experimentally on a mica surface

  16. Combined scanning electrochemical-atomic force microscopy.

    Science.gov (United States)

    Macpherson, J V; Unwin, P R

    2000-01-15

    A combined scanning electrochemical microscope (SECM)-atomic force microscope (AFM) is described. The instrument permits the first simultaneous topographical and electrochemical measurements at surfaces, under fluid, with high spatial resolution. Simple probe tips suitable for SECM-AFM, have been fabricated by coating flattened and etched Pt microwires with insulating, electrophoretically deposited paint. The flattened portion of the probe provides a flexible cantilever (force sensor), while the coating insulates the probe such that only the tip end (electrode) is exposed to the solution. The SECM-AFM technique is illustrated with simultaneous electrochemical-probe deflection approach curves, simultaneous topographical and electrochemical imaging studies of track-etched polycarbonate ultrafiltration membranes, and etching studies of crystal surfaces. PMID:10658320

  17. Friction forces on atoms after acceleration

    International Nuclear Information System (INIS)

    The aim of this paper is to revisit the calculation of atom–surface quantum friction in the quantum field theory formulation put forward by Barton (2010 New J. Phys. 12 113045). We show that the power dissipated into field excitations and the associated friction force depend on how the atom is boosted from being initially at rest to a configuration in which it is moving at constant velocity (v) parallel to the planar interface. In addition, we point out that there is a subtle cancellation between the one-photon and part of the two-photon dissipating power, resulting in a leading order contribution to the frictional power which goes as v4. These results are also confirmed by an alternative calculation of the average radiation force, which scales as v3. (paper)

  18. Microfluidics, Chromatography, and Atomic-Force Microscopy

    Science.gov (United States)

    Anderson, Mark

    2008-01-01

    A Raman-and-atomic-force microscope (RAFM) has been shown to be capable of performing several liquid-transfer and sensory functions essential for the operation of a microfluidic laboratory on a chip that would be used to perform rapid, sensitive chromatographic and spectro-chemical analyses of unprecedentedly small quantities of liquids. The most novel aspect of this development lies in the exploitation of capillary and shear effects at the atomic-force-microscope (AFM) tip to produce shear-driven flow of liquids along open microchannels of a microfluidic device. The RAFM can also be used to perform such functions as imaging liquids in microchannels; removing liquid samples from channels for very sensitive, tip-localized spectrochemical analyses; measuring a quantity of liquid adhering to the tip; and dip-pen deposition from a chromatographic device. A commercial Raman-spectroscopy system and a commercial AFM were integrated to make the RAFM so as to be able to perform simultaneous topographical AFM imaging and surface-enhanced Raman spectroscopy (SERS) at the AFM tip. The Raman-spectroscopy system includes a Raman microprobe attached to an optical microscope, the translation stage of which is modified to accommodate the AFM head. The Raman laser excitation beam, which is aimed at the AFM tip, has a wavelength of 785 nm and a diameter of about 5 m, and its power is adjustable up to 10 mW. The AFM is coated with gold to enable tip-localized SERS.

  19. Atomic Force Microscopy for Soil Analysis

    Science.gov (United States)

    gazze, andrea; doerr, stefan; dudley, ed; hallin, ingrid; matthews, peter; quinn, gerry; van keulen, geertje; francis, lewis

    2016-04-01

    Atomic Force Microscopy (AFM) is a high-resolution surface-sensitive technique, which provides 3-dimensional topographical information and material properties of both stiff and soft samples in their natural environments. Traditionally AFM has been applied to samples with low roughness: hence its use for soil analysis has been very limited so far. Here we report the optimization settings required for a standardization of high-resolution and artefact-free analysis of natural soil with AFM: soil immobilization, AFM probe selection, artefact recognition and minimization. Beyond topography, AFM can be used in a spectroscopic mode to evaluate nanomechanical properties, such as soil viscosity, stiffness, and deformation. In this regards, Bruker PeakForce-Quantitative NanoMechanical (QNM) AFM provides a fast and convenient way to extract physical properties from AFM force curves in real-time to obtain soil nanomechanical properties. Here we show for the first time the ability of AFM to describe the topography of natural soil at nanometre resolution, with observation of micro-components, such as clays, and of nano-structures, possibly of biotic origin, the visualization of which would prove difficult with other instrumentations. Finally, nanomechanical profiling has been applied to different wettability states in soil and the respective physical patterns are discussed.

  20. Atomic force microscopy of biological samples.

    Science.gov (United States)

    Allison, David P; Mortensen, Ninell P; Sullivan, Claretta J; Doktycz, Mitchel J

    2010-01-01

    The ability to evaluate structural-functional relationships in real time has allowed scanning probe microscopy (SPM) to assume a prominent role in post genomic biological research. In this mini-review, we highlight the development of imaging and ancillary techniques that have allowed SPM to permeate many key areas of contemporary research. We begin by examining the invention of the scanning tunneling microscope (STM) by Binnig and Rohrer in 1982 and discuss how it served to team biologists with physicists to integrate high-resolution microscopy into biological science. We point to the problems of imaging nonconductive biological samples with the STM and relate how this led to the evolution of the atomic force microscope (AFM) developed by Binnig, Quate, and Gerber, in 1986. Commercialization in the late 1980s established SPM as a powerful research tool in the biological research community. Contact mode AFM imaging was soon complemented by the development of non-contact imaging modes. These non-contact modes eventually became the primary focus for further new applications including the development of fast scanning methods. The extreme sensitivity of the AFM cantilever was recognized and has been developed into applications for measuring forces required for indenting biological surfaces and breaking bonds between biomolecules. Further functional augmentation to the cantilever tip allowed development of new and emerging techniques including scanning ion-conductance microscopy (SICM), scanning electrochemical microscope (SECM), Kelvin force microscopy (KFM) and scanning near field ultrasonic holography (SNFUH). PMID:20672388

  1. Atomic force microscopy of biological samples

    Energy Technology Data Exchange (ETDEWEB)

    Doktycz, Mitchel John [ORNL

    2010-01-01

    The ability to evaluate structural-functional relationships in real time has allowed scanning probe microscopy (SPM) to assume a prominent role in post genomic biological research. In this mini-review, we highlight the development of imaging and ancillary techniques that have allowed SPM to permeate many key areas of contemporary research. We begin by examining the invention of the scanning tunneling microscope (STM) by Binnig and Rohrer in 1982 and discuss how it served to team biologists with physicists to integrate high-resolution microscopy into biological science. We point to the problems of imaging nonconductive biological samples with the STM and relate how this led to the evolution of the atomic force microscope (AFM) developed by Binnig, Quate, and Gerber, in 1986. Commercialization in the late 1980s established SPM as a powerful research tool in the biological research community. Contact mode AFM imaging was soon complemented by the development of non-contact imaging modes. These non-contact modes eventually became the primary focus for further new applications including the development of fast scanning methods. The extreme sensitivity of the AFM cantilever was recognized and has been developed into applications for measuring forces required for indenting biological surfaces and breaking bonds between biomolecules. Further functional augmentation to the cantilever tip allowed development of new and emerging techniques including scanning ion-conductance microscopy (SICM), scanning electrochemical microscope (SECM), Kelvin force microscopy (KFM) and scanning near field ultrasonic holography (SNFUH).

  2. Investigating cell mechanics with atomic force microscopy.

    Science.gov (United States)

    Haase, Kristina; Pelling, Andrew E

    2015-03-01

    Transmission of mechanical force is crucial for normal cell development and functioning. However, the process of mechanotransduction cannot be studied in isolation from cell mechanics. Thus, in order to understand how cells 'feel', we must first understand how they deform and recover from physical perturbations. Owing to its versatility, atomic force microscopy (AFM) has become a popular tool to study intrinsic cellular mechanical properties. Used to directly manipulate and examine whole and subcellular reactions, AFM allows for top-down and reconstitutive approaches to mechanical characterization. These studies show that the responses of cells and their components are complex, and largely depend on the magnitude and time scale of loading. In this review, we generally describe the mechanotransductive process through discussion of well-known mechanosensors. We then focus on discussion of recent examples where AFM is used to specifically probe the elastic and inelastic responses of single cells undergoing deformation. We present a brief overview of classical and current models often used to characterize observed cellular phenomena in response to force. Both simple mechanistic models and complex nonlinear models have been used to describe the observed cellular behaviours, however a unifying description of cell mechanics has not yet been resolved. PMID:25589563

  3. High-Speed Atomic Force Microscopy

    Science.gov (United States)

    Ando, Toshio; Uchihashi, Takayuki; Kodera, Noriyuki

    2012-08-01

    The technology of high-speed atomic force microscopy (HS-AFM) has reached maturity. HS-AFM enables us to directly visualize the structure and dynamics of biological molecules in physiological solutions at subsecond to sub-100 ms temporal resolution. By this microscopy, dynamically acting molecules such as myosin V walking on an actin filament and bacteriorhodopsin in response to light are successfully visualized. High-resolution molecular movies reveal the dynamic behavior of molecules in action in great detail. Inferences no longer have to be made from static snapshots of molecular structures and from the dynamic behavior of optical markers attached to biomolecules. In this review, we first describe theoretical considerations for the highest possible imaging rate, then summarize techniques involved in HS-AFM and highlight recent imaging studies. Finally, we briefly discuss future challenges to explore.

  4. High-frequency multimodal atomic force microscopy

    Directory of Open Access Journals (Sweden)

    Adrian P. Nievergelt

    2014-12-01

    Full Text Available Multifrequency atomic force microscopy imaging has been recently demonstrated as a powerful technique for quickly obtaining information about the mechanical properties of a sample. Combining this development with recent gains in imaging speed through small cantilevers holds the promise of a convenient, high-speed method for obtaining nanoscale topography as well as mechanical properties. Nevertheless, instrument bandwidth limitations on cantilever excitation and readout have restricted the ability of multifrequency techniques to fully benefit from small cantilevers. We present an approach for cantilever excitation and deflection readout with a bandwidth of 20 MHz, enabling multifrequency techniques extended beyond 2 MHz for obtaining materials contrast in liquid and air, as well as soft imaging of delicate biological samples.

  5. Sharp Tips on the Atomic Force Microscope

    Science.gov (United States)

    2008-01-01

    This image shows the eight sharp tips of the NASA's Phoenix Mars Lander's Atomic Force Microscope, or AFM. The AFM is part of Phoenix's Microscopy, Electrochemistry, and Conductivity Analyzer, or MECA. The microscope maps the shape of particles in three dimensions by scanning them with one of the tips at the end of a beam. For the AFM image taken, the tip at the end of the upper right beam was used. The tip pointing up in the enlarged image is the size of a smoke particle at its base, or 2 microns. This image was taken with a scanning electron microscope before Phoenix launched on August 4, 2007. The AFM was developed by a Swiss-led consortium in collaboration with Imperial College London. The Phoenix Mission is led by the University of Arizona, Tucson, on behalf of NASA. Project management of the mission is by NASA's Jet Propulsion Laboratory, Pasadena, Calif. Spacecraft development is by Lockheed Martin Space Systems, Denver.

  6. Tip characterizer for atomic force microscopy

    Science.gov (United States)

    Itoh, Hiroshi; Fujimoto, Toshiyuki; Ichimura, Shingo

    2006-10-01

    A tip characterizer for atomic force microscopy (AFM) was developed based on the fabrication of multilayer thin films. Comb-shaped line and space (LS) and wedge-shaped knife-edge structures were fabricated on a GaAs substrate. GaAs /InGaP superlattices were used to control the width of the structures precisely, and selective chemical etching was used to form sharp edges on the nanostructures. The minimum size of the LS structure was designed to be 10nm, and the radius of the knife edge was less than 5nm. These nanostructures were used as a well-defined tip characterizer to measure the shape of a tip on a cantilever from line profiles of AFM images.

  7. Measurement adhesion force between fine particle and effect of humidity: An study with Atomic Force Microscopy

    International Nuclear Information System (INIS)

    Adhesion force is interaction between particle- particle and particle surface. First Hertz in 1882 calculated adhesion force between spherical particle and planar surface. Adhesion force in interested for scientist and different industries such as paint, foot, pharmaceutical, etc. In this study we measured adhesion force between fine particle such as silica and silicon and mica surface, with Atomic Force Microscopy. The adhesion force measured between particle-planar surfaces with Atomic Force Microscopy on different humidity and simulated results.

  8. Robust atomic force microscopy using multiple sensors.

    Science.gov (United States)

    Baranwal, Mayank; Gorugantu, Ram S; Salapaka, Srinivasa M

    2016-08-01

    Atomic force microscopy typically relies on high-resolution high-bandwidth cantilever deflection measurements based control for imaging and estimating sample topography and properties. More precisely, in amplitude-modulation atomic force microscopy (AM-AFM), the control effort that regulates deflection amplitude is used as an estimate of sample topography; similarly, contact-mode AFM uses regulation of deflection signal to generate sample topography. In this article, a control design scheme based on an additional feedback mechanism that uses vertical z-piezo motion sensor, which augments the deflection based control scheme, is proposed and evaluated. The proposed scheme exploits the fact that the piezo motion sensor, though inferior to the cantilever deflection signal in terms of resolution and bandwidth, provides information on piezo actuator dynamics that is not easily retrievable from the deflection signal. The augmented design results in significant improvements in imaging bandwidth and robustness, especially in AM-AFM, where the complicated underlying nonlinear dynamics inhibits estimating piezo motions from deflection signals. In AM-AFM experiments, the two-sensor based design demonstrates a substantial improvement in robustness to modeling uncertainties by practically eliminating the peak in the sensitivity plot without affecting the closed-loop bandwidth when compared to a design that does not use the piezo-position sensor based feedback. The contact-mode imaging results, which use proportional-integral controllers for cantilever-deflection regulation, demonstrate improvements in bandwidth and robustness to modeling uncertainties, respectively, by over 30% and 20%. The piezo-sensor based feedback is developed using H∞ control framework. PMID:27587128

  9. Atomic force microscopy characterization of cellulose nanocrystals.

    Science.gov (United States)

    Lahiji, Roya R; Xu, Xin; Reifenberger, Ronald; Raman, Arvind; Rudie, Alan; Moon, Robert J

    2010-03-16

    Cellulose nanocrystals (CNCs) are gaining interest as a "green" nanomaterial with superior mechanical and chemical properties for high-performance nanocomposite materials; however, there is a lack of accurate material property characterization of individual CNCs. Here, a detailed study of the topography, elastic and adhesive properties of individual wood-derived CNCs is performed using atomic force microscopy (AFM). AFM experiments involving high-resolution dynamic mode imaging and jump-mode measurements were performed on individual CNCs under ambient conditions with 30% relative humidity (RH) and under a N(2) atmosphere with 0.1% RH. A procedure was also developed to calculate the CNC transverse elastic modulus (E(T)) by comparing the experimental force-distance curves measured on the CNCs with 3D finite element calculations of tip indentation on the CNC. The E(T) of an isolated CNC was estimated to be between 18 and 50 GPa at 0.1% RH; however, the associated crystallographic orientation of the CNC could not be determined. CNC properties were reasonably uniform along the entire CNC length, despite variations along the axis of 3-8 nm in CNC height. The range of RH used in this study was found to have a minimal effect on the CNC geometry, confirming the resistance of the cellulose crystals to water penetration. CNC flexibility was also investigated by using the AFM tip as a nanomanipulator. PMID:20055370

  10. Carbon nanotube atomic force microscopy probes

    Science.gov (United States)

    Yamanaka, Shigenobu; Okawa, Takashi; Akita, Seiji; Nakayama, Yoshikazu

    2005-05-01

    We have developed a carbon nanotube atomic force microscope probe. Because the carbon nanotube are well known to have high aspect ratios, small tip radii and high stiffness, carbon nanotube probes have a long lifetime and can be applied for the observation deep trenches. Carbon nanotubes were synthesized by a well-controlled DC arc discharge method, because this method can make nanotubes to have straight shape and high crystalline. The nanotubes were aligned on the knife-edge using an alternating current electrophoresis technique. A commercially available Si probe was used for the base of the nanotube probe. The nanotube probe was fabricated by the SEM manipulation method. The nanotube was then attached tightly to the Si probe by deposition of amorphous carbon. We demonstrate the measurement of a fine pith grating that has vertical walls. However, a carbon nanotube has a problem that is called "Sticking". The sticking is a chatter image on vertical like region in a sample. We solved this problem by applying 2 methods, 1. a large cantilever vibration amplitude in tapping mode, 2. an attractive mode measurement. We demonstrate the non-sticking images by these methods.

  11. Calibration of lateral force measurements in atomic force microscopy with a piezoresistive force sensor

    International Nuclear Information System (INIS)

    We present here a method to calibrate the lateral force in the atomic force microscope. This method makes use of an accurately calibrated force sensor composed of a tipless piezoresistive cantilever and corresponding signal amplifying and processing electronics. Two ways of force loading with different loading points were compared by scanning the top and side edges of the piezoresistive cantilever. Conversion factors between the lateral force and photodiode signal using three types of atomic force microscope cantilevers with rectangular geometries (normal spring constants from 0.092 to 1.24 N/m and lateral stiffness from 10.34 to 101.06 N/m) were measured in experiments using the proposed method. When used properly, this method calibrates the conversion factors that are accurate to ±12.4% or better. This standard has less error than the commonly used method based on the cantilever's beam mechanics. Methods such of this allow accurate and direct conversion between lateral forces and photodiode signals without any knowledge of the cantilevers and the laser measuring system

  12. Atomic Force Microscopy on Its Way to Adolescence

    Science.gov (United States)

    Giessibl, Franz J.

    2003-12-01

    When the atomic force microscope (AFM) was introduced in 1986, its potential to resolve surfaces with true atomic resolution was already proposed. However, substantial problems had to be overcome before atomic resolution became possible by AFM. Today, true atomic resolution by AFM is standard practice. This article discusses the influence of the cantilever stiffness and — amplitude on noise and short-range force sensitivity and introduces a sensor operating at near optimal conditions (qPlus sensor). The data achieved with this optimized sensing technology show substructures within single atom images, attributed to atomic orbitals.

  13. Dielectrophoretic immobilization of proteins: Quantification by atomic force microscopy.

    Science.gov (United States)

    Laux, Eva-Maria; Knigge, Xenia; Bier, Frank F; Wenger, Christian; Hölzel, Ralph

    2015-09-01

    The combination of alternating electric fields with nanometer-sized electrodes allows the permanent immobilization of proteins by dielectrophoretic force. Here, atomic force microscopy is introduced as a quantification method, and results are compared with fluorescence microscopy. Experimental parameters, for example the applied voltage and duration of field application, are varied systematically, and the influence on the amount of immobilized proteins is investigated. A linear correlation to the duration of field application was found by atomic force microscopy, and both microscopical methods yield a square dependence of the amount of immobilized proteins on the applied voltage. While fluorescence microscopy allows real-time imaging, atomic force microscopy reveals immobilized proteins obscured in fluorescence images due to low S/N. Furthermore, the higher spatial resolution of the atomic force microscope enables the visualization of the protein distribution on single nanoelectrodes. The electric field distribution is calculated and compared to experimental results with very good agreement to atomic force microscopy measurements. PMID:26010162

  14. Investigating atomic contrast in atomic force microscopy and Kelvin probe force microscopy on ionic systems using functionalized tips

    OpenAIRE

    Gross, Leo; Schuler, Bruno; Mohn, Fabian; Moll, Nikolaj; Pavliček, Niko; Steurer, Wolfram; Scivetti, Ivan; Kotsis, Konstantinos; Persson, Mats; Meyer, Gerhard

    2014-01-01

    Noncontact atomic force microscopy (NC-AFM) and Kelvin probe force microscopy (KPFM) have become important tools for nanotechnology; however, their contrast mechanisms on the atomic scale are not entirely understood. Here we used chlorine vacancies in NaCl bilayers on Cu(111) as a model system to investigate atomic contrast as a function of applied voltage, tip height, and tip functionalization. We demonstrate that the AFM contrast on the atomic scale decisively depends on both the tip termin...

  15. Immunogold labels: cell-surface markers in atomic force microscopy

    NARCIS (Netherlands)

    Putman, Constant A.J.; Grooth, de Bart G.; Hansma, Paul K.; Hulst, van Niek F.; Greve, Jan

    1993-01-01

    The feasibility of using immunogold labels as cell-surface markers in atomic force microscopy is shown in this paper. The atomic force microscope (AFM) was used to image the surface of immunogold-labeled human lymphocytes. The lymphocytes were isolated from whole blood and labeled by an indirect imm

  16. Light forces on an indium atomic beam

    International Nuclear Information System (INIS)

    In this thesis it was studied, whether indium is a possible candidate for the nanostructuration respectively atomic lithography. For this known method for the generation and stabilization of the light necessary for the laser cooling had to be fitted to the special properties of indium. The spectroscopy of indium with the 451 nm and the 410 nm light yielded first hints that the formulae for the atom-light interaction for a two-level atom cannot be directly transferred to the indium atom. By means of the obtained parameters of the present experiment predictions for a possible Doppler cooling of the indium atomic beam were calculated. Furthermore the possibility for the direct deposition of indium on a substrate was studied

  17. Controlled manipulation of atoms in insulating surfaces with the virtual atomic force microscope

    OpenAIRE

    Trevethan, T.; Watkins, M; Kantorovich, L. N.; Shluger, A. L.

    2007-01-01

    We predict how single oxygen ions can be manipulated on the MgO (100) surface and demonstrate the possibility of detecting a single-atom event using a noncontact atomic force microscope. The manipulation process is simulated explicitly in real time with a virtual dynamic atomic force microscope including the full response of the instrumentation and demonstrates a strong dependence on temperature. The proposed new atomistic mechanism and protocols for the controlled manipulation of single atom...

  18. Minimizing tip–sample forces in jumping mode atomic force microscopy in liquid

    International Nuclear Information System (INIS)

    Control and minimization of tip–sample interaction forces are imperative tasks to maximize the performance of atomic force microscopy. In particular, when imaging soft biological matter in liquids, the cantilever dragging force prevents identification of the tip–sample mechanical contact, resulting in deleterious interaction with the specimen. In this work we present an improved jumping mode procedure that allows detecting the tip–sample contact with high accuracy, thus minimizing the scanning forces (∼100 pN) during the approach cycles. To illustrate this method we report images of human adenovirus and T7 bacteriophage particles which are prone to uncontrolled modifications when using conventional jumping mode. -- Highlights: ► Improvement in atomic force microscopy in buffer solution. ► Peak force detection. ► Subtracting the cantilever dragging force. ► Forces in the 100 pN range. ► Imaging of delicate viruses with atomic force microscopy.

  19. Dispersive forces on bodies and atoms: a unified approach

    OpenAIRE

    Raabe, Christian; Welsch, Dirk-Gunnar

    2006-01-01

    A unified approach to the calculation of dispersive forces on ground-state bodies and atoms is given. It is based on the ground-state Lorentz force density acting on the charge and current densities attributed to the polarization and magnetization in linearly, locally, and causally responding media. The theory is applied to dielectric macro- and micro-objects, including single atoms. Existing formulas valid for weakly polarizable matter are generalized to allow also for strongly polarizable m...

  20. Immunogold labels: cell-surface markers in atomic force microscopy

    OpenAIRE

    Putman, Constant A.J.; Grooth, de, B.G.; Hansma, Paul K.; Hulst, van der, R.W.M.; Greve, Jan

    1993-01-01

    The feasibility of using immunogold labels as cell-surface markers in atomic force microscopy is shown in this paper. The atomic force microscope (AFM) was used to image the surface of immunogold-labeled human lymphocytes. The lymphocytes were isolated from whole blood and labeled by an indirect immunolabeling method using the monoclonal antibody anti-CD3 and a secondary antibody (Goat-anti-Mouse) linked to 30 nm colloidal gold particles. Some of the samples were enhanced by silver deposition...

  1. Lorentz force actuation of a heated atomic force microscope cantilever

    International Nuclear Information System (INIS)

    We report Lorentz force-induced actuation of a silicon microcantilever having an integrated resistive heater. Oscillating current through the cantilever interacts with the magnetic field around a NdFeB permanent magnet and induces a Lorentz force that deflects the cantilever. The same current induces cantilever heating. With AC currents as low as 0.2 mA, the cantilever can be oscillated as much as 80 nm at resonance with a DC temperature rise of less than 5 °C. By comparison, the AC temperature variation leads to a thermomechanical oscillation that is about 1000 times smaller than the Lorentz deflection at the cantilever resonance. The cantilever position in the nonuniform magnetic field affects the Lorentz force-induced deflection, with the magnetic field parallel to the cantilever having the largest effect on cantilever actuation. We demonstrate how the cantilever actuation can be used for imaging, and for measuring the local material softening temperature by sensing the contact resonance shift. (paper)

  2. MATCH: An Atom- Typing Toolset for Molecular Mechanics Force Fields

    OpenAIRE

    Yesselman, Joseph D.; Price, Daniel J.; Knight, Jennifer L.; Brooks, Charles L.

    2011-01-01

    We introduce a toolset of program libraries collectively titled MATCH (Multipurpose Atom-Typer for CHARMM) for the automated assignment of atom types and force field parameters for molecular mechanics simulation of organic molecules. The toolset includes utilities for the conversion from multiple chemical structure file formats into a molecular graph. A general chemical pattern-matching engine using this graph has been implemented whereby assignment of molecular mechanics atom types, charges ...

  3. Study of adhesive forces on a silicon nanotip by atomic force microscope in contact mode

    Science.gov (United States)

    Agache, Vincent; Legrand, Bernard; Collard, Dominique; Buchaillot, Lionel

    2002-04-01

    Atomic Force Microscope operating in contact mode is used in this paper for probing the spatial distribution of adhesive forces versus the topography of a silicon nanotip. This nanotip consists in an ultra sha4rp silicon tip with radius less than 15 nm fabricated using a combination of high- resolution electron beam lithography and plasma dry etching. The amplitude of the forces is determined from force versus distance curve measurements. Hence, by determining the contact point and the pull-off force from the force curves, the surface topography and the adhesive forces are simultaneously obtained at various locations on the surface. This paper reports both measurements and the modeling of adhesive forces versus the contact point on the nanotip. As the nanotip is sharper and has got a smaller aperture angle than the employed Atomic Force Microscope tip, the measurements are focused on the nanotip apex.

  4. Adhesive forces investigation on a silicon tip by contact-mode atomic force microscope

    Science.gov (United States)

    Agache, Vincent; Legrand, Bernard; Collard, Dominique; Buchaillot, Lionel

    2002-09-01

    An atomic force microscope operating in contact mode is used in this letter for probing the adhesive forces at the apex of a silicon nanotip with typical radius smaller than 15 nm, fabricated using a combination of high-resolution electron beam lithography and plasma dry etching. The amplitude of the forces is deduced from force versus distance curve measurements. By determining the contact point and the pull-off force from the force curves, the surface topography and the adhesive forces are simultaneously obtained at various locations on the surface. This letter reports both measurements and modeling of adhesive forces versus the contact point on the nanotip. As the nanotip is sharper and has a smaller aperture angle than the employed atomic force microscope tip, the measurements are focused on the nanotip apex.

  5. Lead zirconate titanate cantilever for noncontact atomic force microscopy

    Science.gov (United States)

    Miyahara, Y.; Fujii, T.; Watanabe, S.; Tonoli, A.; Carabelli, S.; Yamada, H.; Bleuler, H.

    1999-02-01

    Noncontact atomic force microscopy with frequency modulation detection is a promising technique for surface observation with true atomic resolution. The piezoelectric material itself can be an actuator and sensor of the oscillating probe simultaneously, without the need for additional electro-mechanical transducers or other measurement systems. A vertical resolution of 0.01 nm rms has been achieved using a microfabricated cantilever with lead zirconate titanate thin film in noncontact mode frequency modulation detection. The cantilever also has a sharpened pyramidal stylus with a radius of about 10 nm for noncontact atomic force microscopy.

  6. Theory of Atomic-Force Microscopy(STM Theory)

    OpenAIRE

    Sasaki, Naruo; Tsukada, Masaru

    1997-01-01

    The mechanism of force detection of Atomic-Force Microscopy (AFM) is theoretically investigated. First, a theoretical simulation of contact AFM images is performed, and a tip apex structure is studied. It is clarified how the AFM images and the force distributions change as the load varies. It is also revealed that the characteristics of the AFM images such as their detailed microscopic pattern, the symmetry, and the corrugation amplitude, depend strongly on the tip apex structure. Secondly, ...

  7. Cooling and trapping neutral atoms with radiative forces

    International Nuclear Information System (INIS)

    Techniques to slow and trap neutral atoms at high densities with radiative forces are discussed in this review articles. Among several methods of laser cooling, it is emphasized Zeeman Tuning of the electronic levels and frequency-sweeping techniques. Trapping of neutral atoms and recent results obtained in light and magnetic traps are discussed. Techniques to further cool atoms inside traps are presented and the future of laser cooling of neutral atoms by means of radiation pressure is discussed. (A.C.A.S.)

  8. Study of surface forces dependence on pH by atomic force microscopy.

    Science.gov (United States)

    Gavoille, J; Takadoum, J

    2002-06-01

    We used an atomic force microscope to investigate silicon nitride tip interactions with various materials (copper, nickel, silicon carbide) as a function of pH. The electrolyte used was 10(-3) M NaCl and the interactions observed through force versus distance curves (attraction or repulsion) depended on the pH value. Interaction forces calculation was derived from force versus distance curve data and the results are discussed in terms of electrostatic interactions using Zeta potential theory. PMID:16290640

  9. Precision measurements of the Casimir force using an atomic force microscope

    International Nuclear Information System (INIS)

    The Casimir force results from the alteration by boundaries of the zero point electromagnetic energy. We have used the atomic force microscope to make precision measurements of the Casimir force between a large gold coated sphere and a flat plate. The complete dielectric spectrum of the metal is used in the comparison of theory to the experiment. The average statistical precision is around 1% of the forces measured at the closest separation

  10. Manipulation of cadmium selenide nanorods with an atomic force microscope

    International Nuclear Information System (INIS)

    We have used an atomic force microscope (AFM) to manipulate and study ligand-capped cadmium selenide nanorods deposited on highly oriented pyrolitic graphite (HOPG). The AFM tip was used to manipulate (i.e., translate and rotate) the nanorods by applying a force perpendicular to the nanorod axis. The manipulation result was shown to depend on the point of impact of the AFM tip with the nanorod and whether the nanorod had been manipulated previously. Forces applied parallel to the nanorod axis, however, did not give rise to manipulation. These results are interpreted by considering the atomic-scale interactions of the HOPG substrate with the organic ligands surrounding the nanorods. The vertical deflection of the cantilever was recorded during manipulation and was combined with a model in order to estimate the value of the horizontal force between the tip and nanorod during manipulation. This horizontal force is estimated to be on the order of a few tens of nN.

  11. Edge Effects and Coupling Effects in Atomic Force Microscope Images

    Institute of Scientific and Technical Information of China (English)

    ZHANGXiang-jun; MENGYong-gang; WENShi-zhu

    2004-01-01

    The AFM images were obtained by an atomic force microscope (AFM) and transformed from the deformation of AFM micro cantilever probe. However, due to the surface topography and surface forces applied on the AFM tip of sample, the deformation of AFM probe results in obvious edge effects and coupling effects in the AFM images. The deformation of AFM probe was analyzed,the mechanism of the edge effects and the coupling effects was investigated, and their results in the AFM images were studied. It is demanstrated by the theoretical analysis and AFM experiments that the edge effects make lateral force images more clear than the topography images, also make extraction of frictional force force from lateral force images mare complex and difficult. While the coupling effects make the comparison between topography images and lateral force images mare advantage to acquire precise topography information by AFM.

  12. Real-time atomic force microscopy in lubrication condition

    International Nuclear Information System (INIS)

    We have studied frictional force and wear problem in real-time atomic force microscopy in contact-mode using a resonator type mechanical scanner allegedly reported. The fast scanning may cause wear in the sample surface or the tip, and may deteriorate the image quality. Mineral oil was used to make a lubricious surface on a polycarbonate sample, and it was found that the interfacial frictional force was decreased. A Si tip which was coated with a hydrophobic film by means of chemical modification was confirmed to diminish the frictional force in the fast scanning process. The resultant image quality was improved due to reduced friction and wear.

  13. High-speed force mapping on living cells with a small cantilever atomic force microscope

    International Nuclear Information System (INIS)

    The imaging speed of the wide-spread force mapping mode for quantitative mechanical measurements on soft samples in liquid with the atomic force microscope (AFM) is limited by the bandwidth of the z-scanner and viscous drag forces on the cantilever. Here, we applied high-speed, large scan-range atomic force microscopy and small cantilevers to increase the speed of force mapping by ≈10−100 times. This allowed resolving dynamic processes on living mouse embryonic fibroblasts. Cytoskeleton reorganization during cell locomotion, growth of individual cytoskeleton fibers, cell blebbing, and the formation of endocytic pits in the cell membrane were observed. Increasing the force curve rate from 2 to 300 Hz increased the measured apparent Young's modulus of the cells by about 10 times, which facilitated force mapping measurements at high speed

  14. Sub-Angstrom oscillation amplitude non-contact atomic force microscopy for lateral force gradient measurement

    International Nuclear Information System (INIS)

    We report the first results from novel sub-Angstrom oscillation amplitude non-contact atomic force microscopy developed for lateral force gradient measurements. Quantitative lateral force gradients between a tungsten tip and Si(1 1 1)-(7 x 7) surface can be measured using this microscope. Simultaneous lateral force gradient and scanning tunnelling microscope images of single and multi atomic steps are obtained. In our measurement, tunnel current is used as feedback. The lateral stiffness contrast has been observed to be 2.5 N/m at single atomic step, in contrast to 13 N/m at multi atomic step on Si(1 1 1) surface. We also carried out a series of lateral stiffness-distance spectroscopy. We observed lateral stiffness-distance curves exhibit sharp increase in the stiffness as the sample is approached towards the surface. We usually observed positive stiffness and sometimes going into slightly negative region.

  15. Adsorption Geometry Determination of Single Molecules by Atomic Force Microscopy

    OpenAIRE

    Schuler, Bruno; Liu, Wei; Tkatchenko, Alexandre; Moll, Nikolaj; Meyer, Gerhard; Mistry, Anish; Fox, David; GROSS, Leo

    2013-01-01

    We measured the adsorption geometry of single molecules with intramolecular resolution using noncontact atomic force microscopy with functionalized tips. The lateral adsorption position was determined with atomic resolution, adsorption height differences with a precision of 3 pm, and tilts of the molecular plane within 0.2 degrees. The method was applied to five pi-conjugated molecules, including three molecules from the olympicene family, adsorbed on Cu(111). For the olympicenes, we found th...

  16. Nonequilibrium Atom-Dielectric Forces Mediated by a Quantum Field

    OpenAIRE

    Behunin, Ryan Orson; Hu, Bei-Lok

    2011-01-01

    In this paper we give a first principles microphysics derivation of the nonequilibrium forces between an atom, treated as a three dimensional harmonic oscillator, and a bulk dielectric medium modeled as a continuous lattice of oscillators coupled to a reservoir. We assume no direct interaction between the atom and the medium but there exist mutual influences transmitted via a common electromagnetic field. By employing concepts and techniques of open quantum systems we introduce coarse-grainin...

  17. Intermittent contact atomic force microscopy in electrochemical environment

    Energy Technology Data Exchange (ETDEWEB)

    Haering, P.; Koetz, R. [Paul Scherrer Inst. (PSI), Villigen (Switzerland); Siegenthaler, H. [Bern Univ., Bern (Switzerland)

    1997-06-01

    In situ measurements with Atomic Force Microscopy may cause surface modifications due to the tip-surface interactions. As an alternative and less destructive method, Intermittent Contact Atomic Force Microscopy (ICAFM) has been tested in an electrolytic environment. In the ICAFM mode the tip is not constantly in contact with the surface under investigation but is tapping onto the surface with a certain frequency. A commercial Park Scientific Instruments Microscopy has been modified to enable in situ experiment with ICAFM. It was possible to image iridium oxide films with ICAFM in the electrolytic environment without any noticeable surface modifications. (author) 3 figs., 4 refs.

  18. Taking Nanomedicine Teaching into Practice with Atomic Force Microscopy and Force Spectroscopy

    Science.gov (United States)

    Carvalho, Filomena A.; Freitas, Teresa; Santos, Nuno C.

    2015-01-01

    Atomic force microscopy (AFM) is a useful and powerful tool to study molecular interactions applied to nanomedicine. The aim of the present study was to implement a hands-on atomic AFM course for graduated biosciences and medical students. The course comprises two distinct practical sessions, where students get in touch with the use of an atomic…

  19. Coaxial atomic force microscope probes for imaging with dielectrophoresis

    OpenAIRE

    Brown, Keith; Berezovsky, Jesse; Westervelt, Robert M.

    2011-01-01

    We demonstrate atomic force microscope (AFM) imaging using dielectrophoresis (DEP) with coaxial probes. DEP provides force contrast allowing coaxial probes to image with enhanced spatial resolution. We model a coaxial probe as an electric dipole to provide analytic formulas for DEP between a dipole, dielectric spheres, and a dielectric substrate. AFM images taken of dielectric spheres with and without an applied electric field show the disappearance of artifacts when imaging with DEP. Quantit...

  20. Magnetic moment measurement of magnetic nanoparticles using atomic force microscopy

    International Nuclear Information System (INIS)

    Magnetic moment per unit mass of magnetic nanoparticles was found by using the atomic force microscope (AFM). The mass of the nanoparticles was acquired from the resonance frequency shift of the particle-attached AFM probe and magnetic force measurement was also carried out with the AFM. Combining with magnetic field strength, the magnetic moment per unit mass of the nanoparticles was determined as a function of magnetic field strength. (technical design note)

  1. Mapping Electrostatic Forces Using Higher Harmonics Tapping Mode Atomic Force Microscopy in Liquid

    NARCIS (Netherlands)

    Noort, van S. John T.; Willemsen, Oscar H.; Werf, van der Kees O.; Grooth, de Bart G.; Greve, Jan

    1999-01-01

    A simple model of a damped, harmonic oscillator is used to describe the motion of an atomic force microscope cantilever tapping in fluid. By use of experimentally obtained parameters, excellent agreement is found between theory and experimental results. From the model we estimate that the force appl

  2. Properties of Atoms in Molecules:  Caged Atoms and the Ehrenfest Force.

    Science.gov (United States)

    Bader, Richard F W; Fang, De-Cai

    2005-05-01

    This paper uses the properties of atom X enclosed within an adamantane cage, denoted by X@C10H16, as a vehicle to introduce the Ehrenfest force into the discussion of bonding, the properties being determined by the physics of an open system. This is the force acting on an atom in a molecule and determining the potential energy appearing in Slater's molecular virial theorem. The Ehrenfest force acting across the interatomic surface of a bonded pair atoms [Formula: see text] atoms linked by a bond path [Formula: see text] is attractive, each atom being drawn toward the other, and the associated surface virial that measures the contribution to the energy arising from the formation of the surface is stabilizing. It is the Ehrenfest force that determines the adhesive properties of surfaces. The endothermicity of formation for X = He or Ne is not a result of instabilities incurred in the interaction of X with the four methine carbons to which it is bonded, interactions that are stabilizing both in terms of the changes in the atomic energies and in the surface virials. The exothermicity for X = Be(2+), B(3+), and Al(3+) is a consequence of the transfer of electron density from the hydrogen atoms to the carbon and X atoms, the exothermicity increasing with charge transfer despite an increase in the contained volume of X. PMID:26641507

  3. Large momentum transfer atom interferometry with Coriolis force compensation

    Science.gov (United States)

    Kuan, Pei-Chen; Lan, Shau-Yu; Estey, Brian; Haslinger, Philipp; Mueller, Holger

    2012-06-01

    Light-pulse atom interferometers use atom-photon interactions to coherently split, guide, and recombine freely falling matter-waves. Because of Earth's rotation, however, the matter-waves do not recombine precisely, which causes severe loss of contrast in large space-time atom interferometers. I will present our recent progress in using a tip-tilt mirror to remove the influence of the Coriolis force from Earth's rotation. Therefore, we improve the contrast and suppress systematic effects, also reach what is to our knowledge the largest spacetime area.

  4. Experimental Investigation of the Velocity Effect on Adhesion Forces with an Atomic Force Microscope

    Institute of Scientific and Technical Information of China (English)

    魏征; 赵亚溥

    2004-01-01

    Capillary forces are significantly dominant in adhesive forces measured with an atomic force microscope (AFM)in ambient air, which are always thought to be dependent on water film thickness, relative humidity, and the free energy of water film. We study the nature of the pull-off force on a variety of surfaces as a function of tip velocity.It is found that the capillary forces are of relatively strong dependence on tip velocity. The present experiment is expected to provide a better understanding of the work mechanism of AFM in ambient air.

  5. Controlling atom motion through the dipole-dipole force

    International Nuclear Information System (INIS)

    We describe simulations that illustrate the possibility for manipulating the position correlation of atoms in a magneto-optical trap (MOT) using the dipole-dipole interaction. The control scheme utilizes a narrow band laser that is detuned to the high-frequency side of a single-photon Rydberg transition in an isolated atom. As two atoms move near each other, they can be laser excited to repelling diatomic Rydberg-Rydberg potential energy curves which halt their approach. By chirping the laser from large to small detunings, atoms in a MOT can be pushed apart by dipole-dipole forces, thereby controlling nearest-neighbor interactions. Alternatively, by holding the frequency of the Rydberg excitation laser fixed as the MOT is loaded, it should be possible to limit the minimum distance between atoms to a prescribed value

  6. Athermalization in atomic force microscope based force spectroscopy using matched microstructure coupling

    OpenAIRE

    Torun, H.; Finkler, O.; Degertekin, F. L.

    2009-01-01

    The authors describe a method for athermalization in atomic force microscope (AFM) based force spectroscopy applications using microstructures that thermomechanically match the AFM probes. The method uses a setup where the AFM probe is coupled with the matched structure and the displacements of both structures are read out simultaneously. The matched structure displaces with the AFM probe as temperature changes, thus the force applied to the sample can be kept constant without the need for a ...

  7. Probing charges on the atomic scale by means of atomic force microscopy

    Czech Academy of Sciences Publication Activity Database

    Albrecht, F.; Repp, J.; Fleischmann, M.; Scheer, M.; Ondráček, Martin; Jelínek, Pavel

    2015-01-01

    Roč. 115, č. 7 (2015), "076101-1"-"076101-5". ISSN 0031-9007 R&D Projects: GA ČR(CZ) GC14-16963J Institutional support: RVO:68378271 Keywords : Kelvin probe force microscopy * atomic force microscopy * bond polarity * surface dipole * adsorbates on surfaces Subject RIV: BM - Solid Matter Physics ; Magnetism Impact factor: 7.512, year: 2014

  8. Adhesive properties of Staphylococcus epidermidis probed by atomic force microscopy

    DEFF Research Database (Denmark)

    Hu, Yifan; Ulstrup, Jens; Zhang, Jingdong;

    2011-01-01

    (biofilm positive and biofilm negative strains) were analyzed using in situ atomic force microscopy (AFM). Force measurements performed using bare hydrophilic silicon nitride tips disclosed similar adhesive properties for each strain. However, use of hydrophobic tips showed that hydrophobic forces are not......Mapping of the surface properties of Staphylococcus epidermidis and of biofilm forming bacteria in general is a key to understand their functions, particularly their adhesive properties. To gain a comprehensive view of the structural and chemical properties of S. epidermidis, four different strains...

  9. Minimizing tip-sample forces in jumping mode atomic force microscopy in liquid

    Energy Technology Data Exchange (ETDEWEB)

    Ortega-Esteban, A. [Departamento de Fisica de la Materia Condensada, C-3, Universidad Autonoma de Madrid, Cantoblanco, 28049 Madrid (Spain); Horcas, I. [Nanotec Electronica S.L., Centro Empresarial Euronova 3, Ronda de Poniente 12, 28760 Tres Cantos, Madrid (Spain); Hernando-Perez, M. [Departamento de Fisica de la Materia Condensada, C-3, Universidad Autonoma de Madrid, Cantoblanco, 28049 Madrid (Spain); Ares, P. [Nanotec Electronica S.L., Centro Empresarial Euronova 3, Ronda de Poniente 12, 28760 Tres Cantos, Madrid (Spain); Perez-Berna, A.J.; San Martin, C.; Carrascosa, J.L. [Centro Nacional de Biotecnologia (CNB-CSIC), Darwin 3, 28049 Madrid (Spain); Pablo, P.J. de [Departamento de Fisica de la Materia Condensada, C-3, Universidad Autonoma de Madrid, Cantoblanco, 28049 Madrid (Spain); Gomez-Herrero, J., E-mail: julio.gomez@uam.es [Departamento de Fisica de la Materia Condensada, C-3, Universidad Autonoma de Madrid, Cantoblanco, 28049 Madrid (Spain)

    2012-03-15

    Control and minimization of tip-sample interaction forces are imperative tasks to maximize the performance of atomic force microscopy. In particular, when imaging soft biological matter in liquids, the cantilever dragging force prevents identification of the tip-sample mechanical contact, resulting in deleterious interaction with the specimen. In this work we present an improved jumping mode procedure that allows detecting the tip-sample contact with high accuracy, thus minimizing the scanning forces ({approx}100 pN) during the approach cycles. To illustrate this method we report images of human adenovirus and T7 bacteriophage particles which are prone to uncontrolled modifications when using conventional jumping mode. -- Highlights: Black-Right-Pointing-Pointer Improvement in atomic force microscopy in buffer solution. Black-Right-Pointing-Pointer Peak force detection. Black-Right-Pointing-Pointer Subtracting the cantilever dragging force. Black-Right-Pointing-Pointer Forces in the 100 pN range. Black-Right-Pointing-Pointer Imaging of delicate viruses with atomic force microscopy.

  10. Bifurcation, chaos, and scan instability in dynamic atomic force microscopy

    Science.gov (United States)

    Cantrell, John H.; Cantrell, Sean A.

    2016-03-01

    The dynamical motion at any point on the cantilever of an atomic force microscope can be expressed quite generally as a superposition of simple harmonic oscillators corresponding to the vibrational modes allowed by the cantilever shape. Central to the dynamical equations is the representation of the cantilever-sample interaction force as a polynomial expansion with coefficients that account for the interaction force "stiffness," the cantilever-to-sample energy transfer, and the displacement amplitude of cantilever oscillation. Renormalization of the cantilever beam model shows that for a given cantilever drive frequency cantilever dynamics can be accurately represented by a single nonlinear mass-spring model with frequency-dependent stiffness and damping coefficients [S. A. Cantrell and J. H. Cantrell, J. Appl. Phys. 110, 094314 (2011)]. Application of the Melnikov method to the renormalized dynamical equation is shown to predict a cascade of period doubling bifurcations with increasing cantilever drive force that terminates in chaos. The threshold value of the drive force necessary to initiate bifurcation is shown to depend strongly on the cantilever setpoint and drive frequency, effective damping coefficient, nonlinearity of the cantilever-sample interaction force, and the displacement amplitude of cantilever oscillation. The model predicts the experimentally observed interruptions of the bifurcation cascade for cantilevers of sufficiently large stiffness. Operational factors leading to the loss of image quality in dynamic atomic force microscopy are addressed, and guidelines for optimizing scan stability are proposed using a quantitative analysis based on system dynamical parameters and choice of feedback loop parameter.

  11. Design of cantilever probes for Atomic Force Microscopy (AFM)

    DEFF Research Database (Denmark)

    Pedersen, Niels Leergaard

    2000-01-01

    A cantilever beam used in an Atomic Force Microscope is optimized with respect to two different objectives. The first goal is to maximize the first eigenfrequency while keeping the stiffness of the probe constant. The second goal is to maximize the tip angle of the first eigenmode while again kee...

  12. Fabrication of an all-metal atomic force microscope probe

    DEFF Research Database (Denmark)

    Rasmussen, Jan Pihl; Tang, Peter Torben; Hansen, Ole;

    1997-01-01

    This paper presents a method for fabrication of an all-metal atomic force microscope probe (tip, cantilever and support) for optical read-out, using a combination of silicon micro-machining and electroforming. The paper describes the entire fabrication process for a nickel AFM-probe. In addition...

  13. Microbially influenced corrosion visualized by atomic force microscopy

    Science.gov (United States)

    Telegdi, J.; Keresztes, Z.; Pálinkás, G.; Kálmán, E.; Sand, W.

    Corrosion, biofilm formation and the adsorption of different, corrosion-enhancing microbes (such as Desulfovibrio desulfuricans, Thiobacillus ferrooxidans, Thiobacillus intermedius, Leptospirillum ferrooxidans, and mixed cultures) to different surfaces (iron, copper, pyrite) have been studied in aqueous environment by atomic force microscopy (AFM). It is one of the most effective on-line techniques for imaging surfaces (bacterial, metallic, etc.) with high resolution.

  14. Survey on result promotion of the atomic force technique

    International Nuclear Information System (INIS)

    By change of environment around research and development of atomic force, investigation has been recently executed not only on a theme directing a specific aim, but also on technical development considering some applications to the other field reflected by social needs. Therefore, an effective procedure and program capable of reflecting and promoting results of the atomic fore development to other industrial field were necessary. In this study, methods of evaluation and industrialization on study results of the atomic force were investigated. As a result, in order to promote the study results to other field, it was found to be important that some free reasons and concept engineering to mediate between developing and applying sides were to be present. In addition, it was suggested by some searches that a new atomic industry has a probability to be created by using potential energies such as heat, radiation, pulse, and so on. In this paper, evaluation on industrialization of the atomic force technical resources, and establishment of the industrialization program were described. (G.K.)

  15. Atomic force microscope probe-based nanometric scribing

    International Nuclear Information System (INIS)

    Miniaturization of machine components is recognized by many as a significant technological development for a vast spectrum of products. An atomic force microscope (AFM) probe that can exert forces onto a variety of engineering materials is used to perform mechanical scribing at the nanoscale. The success of nanomechanical machining at such fine scales is based on the understanding of microstructural machining mechanics. This paper investigates the cutting behaviour in the nanoscale of a chromium workpiece by using a retrofitted commercial AFM with an acoustic emission sensor, in order to scratch the surface and measure forces. The calibration procedure for acquiring the forces is discussed. The cutting force model, which incorporates the flow stress and friction coefficient in the nano-scale machining, is also presented

  16. Casimir force experiments with quartz tuning forks and an atomic force microscope (AFM)

    Energy Technology Data Exchange (ETDEWEB)

    Ludwig, T [Binnotec, Bouchestr. 12, 12435 Berlin (Germany)], E-mail: DrLudwig@thorstenludwig.de

    2008-04-25

    The aim of the measurement series is to study the Casimir force, specifically the effects of different materials and geometries. The art of measuring sub-nano Newton forces has been engineered to a great extent in the material sciences, especially for the atomic force microscope. In today's scanning microscope technologies there are several common methods used to measure sub-nano Newton forces. While the commercial atomic force microscopes (AFM) mostly work with soft silicon cantilevers, there are a large number of reports from university groups on the use of quartz tuning forks to get high resolution AFM pictures, to measure shear forces or to create new force sensors. The quartz tuning fork based force sensor has a number of advantages over the silicon cantilever, but also has some disadvantages. In this report the method based on quartz tuning forks is described with respect to their usability for Casimir force measurements and compared with other successful techniques. Furthermore, a design for Casimir force measurements that was set up in Berlin will be described and practical experimental aspects will be discussed. A status report on the Casimir experiments in Berlin will be given, including the experimental setup. In order to study the details of the Casimir effect the apparatus and active surfaces have to be improved further. The surfaces have to be flatter and cleaner. For better resolution, cantilevers and tuning forks with a low spring constant have to be employed.

  17. Casimir force experiments with quartz tuning forks and an atomic force microscope (AFM)

    International Nuclear Information System (INIS)

    The aim of the measurement series is to study the Casimir force, specifically the effects of different materials and geometries. The art of measuring sub-nano Newton forces has been engineered to a great extent in the material sciences, especially for the atomic force microscope. In today's scanning microscope technologies there are several common methods used to measure sub-nano Newton forces. While the commercial atomic force microscopes (AFM) mostly work with soft silicon cantilevers, there are a large number of reports from university groups on the use of quartz tuning forks to get high resolution AFM pictures, to measure shear forces or to create new force sensors. The quartz tuning fork based force sensor has a number of advantages over the silicon cantilever, but also has some disadvantages. In this report the method based on quartz tuning forks is described with respect to their usability for Casimir force measurements and compared with other successful techniques. Furthermore, a design for Casimir force measurements that was set up in Berlin will be described and practical experimental aspects will be discussed. A status report on the Casimir experiments in Berlin will be given, including the experimental setup. In order to study the details of the Casimir effect the apparatus and active surfaces have to be improved further. The surfaces have to be flatter and cleaner. For better resolution, cantilevers and tuning forks with a low spring constant have to be employed

  18. Influence of atomic force microscope (AFM) probe shape on adhesion force measured in humidity environment

    Institute of Scientific and Technical Information of China (English)

    阳丽; 涂育松; 谭惠丽

    2014-01-01

    In micro-manipulation, the adhesion force has very important influence on behaviors of micro-objects. Here, a theoretical study on the effects of humidity on the adhesion force is presented between atomic force microscope (AFM) tips and substrate. The analysis shows that the precise tip geometry plays a critical role on humidity depen-dence of the adhesion force, which is the dominant factor in manipulating micro-objects in AFM experiments. For a blunt (paraboloid) tip, the adhesion force versus humidity curves tends to the apparent contrast (peak-to-valley corrugation) with a broad range. This paper demonstrates that the abrupt change of the adhesion force has high correla-tion with probe curvatures, which is mediated by coordinates of solid-liquid-vapor contact lines (triple point) on the probe profiles. The study provides insights for further under-standing nanoscale adhesion forces and the way to choose probe shapes in manipulating micro-objects in AFM experiments.

  19. Elasticity Maps of Living Neurons Measured by Combined Fluorescence and Atomic Force Microscopy

    CERN Document Server

    Spedden, Elise; Naumova, Elena N; Kaplan, David L; Staii, Cristian

    2013-01-01

    Detailed knowledge of mechanical parameters such as cell elasticity, stiffness of the growth substrate, or traction stresses generated during axonal extensions is essential for understanding the mechanisms that control neuronal growth. Here we combine Atomic Force Microscopy based force spectroscopy with Fluorescence Microscopy to produce systematic, high-resolution elasticity maps for three different types of live neuronal cells: cortical (embryonic rat), embryonic chick dorsal root ganglion, and P-19 (mouse embryonic carcinoma stem cells) neurons. We measure how the stiffness of neurons changes both during neurite outgrowth and upon disruption of microtubules of the cell. We find reversible local stiffening of the cell during growth, and show that the increase in local elastic modulus is primarily due to the formation of microtubules. We also report that cortical and P-19 neurons have similar elasticity maps, with elastic moduli in the range 0.1-2 kPa, with typical average values of 0.4 kPa (P-19) and 0.2 k...

  20. The scattering of atoms by forces of stimulated light pressure

    Science.gov (United States)

    Grinchuk, V. A.; Kazantsev, A. P.; Kuzin, E. F.; Nagaeva, M. L.; Riabenko, G. A.; Surdutovich, G. I.; Iakovlev, V. P.

    1984-01-01

    Stimulated light pressure under conditions where the resonance transition is strongly saturated is investigated theoretically and experimentally for times of interaction between the atom and the field that are less than the time of spontaneous emission. Experimental techniques are described for investigating the scattering of a beam of atoms by the field of a standing light wave. Experimental relations are presented which relate the scattering efficiency to the magnitude of the electric field and the resonance detuning. These experimental relations are then compared with the results obtained from calculations that use the effective potential and are based on a quasi-classical description of the motion of atoms in the field of a light wave. It is shown that the scattering efficiency of atoms by forces of stimulated light pressure is of the order of unity even in comparatively weak (100-1000 V/cm) fields of laser radiation.

  1. Improved atomic force microscopy cantilever performance by partial reflective coating

    Directory of Open Access Journals (Sweden)

    Zeno Schumacher

    2015-07-01

    Full Text Available Optical beam deflection systems are widely used in cantilever based atomic force microscopy (AFM. Most commercial cantilevers have a reflective metal coating on the detector side to increase the reflectivity in order to achieve a high signal on the photodiode. Although the reflective coating is usually much thinner than the cantilever, it can still significantly contribute to the damping of the cantilever, leading to a lower mechanical quality factor (Q-factor. In dynamic mode operation in high vacuum, a cantilever with a high Q-factor is desired in order to achieve a lower minimal detectable force. The reflective coating can also increase the low-frequency force noise. In contact mode and force spectroscopy, a cantilever with minimal low-frequency force noise is desirable. We present a study on cantilevers with a partial reflective coating on the detector side. For this study, soft (≈0.01 N/m and stiff (≈28 N/m rectangular cantilevers were used with a custom partial coating at the tip end of the cantilever. The Q-factor, the detection and the force noise of fully coated, partially coated and uncoated cantilevers are compared and force distance curves are shown. Our results show an improvement in low-frequency force noise and increased Q-factor for the partially coated cantilevers compared to fully coated ones while maintaining the same reflectivity, therefore making it possible to combine the best of both worlds.

  2. Interaction between polystyrene spheres by atomic force microscopy

    CERN Document Server

    Looi, L

    2002-01-01

    The interaction between a single polystyrene particle and a polystyrene substrate has been previously reported by a number of investigators. However, the effects of relative humidity, applied load and contact time on the adhesion of polystyrene surfaces have not been investigated and these effects are poorly understood. It is the primary aim of the current work to characterise the effect of the aforementioned parameters on the adhesion of polystyrene surfaces using atomic force microscopy. The polystyrene used in this study contained 1% of di-vinyl benzene as a cross-linking agent. From the work conducted using the custom-built instrument, the dependency of adhesion forces on the relative humidity is greatest at relative humidities above 60% where capillary forces cause a sharp increase in adhesion with increasing relative humidity. Hysteresis was observed in the solid-solid contact gradient of the accompanying force curves, suggesting non-elastic behaviour at the contact area of the surfaces

  3. Theoretical Study on the Capillary Force between an Atomic Force Microscope Tip and a Nanoparticle

    Institute of Scientific and Technical Information of China (English)

    LI Zhao-Xia; ZHANG Li-Juan; YI Hou-Hui; FANG Hai-Ping

    2007-01-01

    @@ Considering that capillary force is one of the most important forces between nanoparticles and atomic force microscope (AFM) tips in ambient atmosphere, we develop an analytic approach on the capillary force between an AFM tip and a nanoparticle. The results show that the capillary forces are considerably affected by the geometry of the AFM tip, the humidity of the environment, the vertical distance between the AFM tip and the nanoparticle, as well as the contact angles of the meniscus with an AFM tip and a nanoparticle. It is found that the sharper the AFM tip, the smaller the capillary force. The analyses and results are expected to be helpful for the quantitative imaging and manipulating of nanoparticles by AFMs.

  4. High Resolution Imaging by Atomic Force Microscopy: Contribution of short-range force to the imaging

    Science.gov (United States)

    Eguchi, Toyoaki; Kotone, Akiyama; Masanori, Ono; Toshio, Sakurai; Yukio, Hasegawa

    2003-03-01

    Recent developments in force detection technique have made us possible to obtain atomically resolved images of the Si(111)-(7x7) surface by AFM. Compared with STM, however, its spatial resolution remains limited. In this presentation, we demonstrate that with careful pretreatment and appropriate experimental parameters, the structure of the rest-atom layer can be imaged using AFM by detecting the short-range force due to the single chemical bonding. The detection of the short-range force is verified by analysis of the frequency-shift versus distance curve (force curve). This unprecedented high resolution is achieved by reducing background forces due to the long-range interactions with small oscillation amplitude of the cantilever and an atomically sharp tip. The high temperature annealing of the cantilever assists in obtaining a bare silicon tip on the cantilever without unwanted tip-blunting, and improving the Q-factor of the cantilever. This study implies that characterization of the AFM tip in nanometer scale, not only on the apex atoms but also its shape near the apex, is important and critical for AFM high resolution imaging.

  5. Self-oscillating tapping mode atomic force microscopy

    Science.gov (United States)

    Manning, L.; Rogers, B.; Jones, M.; Adams, J. D.; Fuste, J. L.; Minne, S. C.

    2003-09-01

    A piezoelectric microcantilever probe is demonstrated as a self-oscillator used for tapping mode atomic force microscopy. The integrated piezoelectric film on the cantilever serves as the frequency-determining component of an oscillator circuit; oscillation near the cantilever's resonant frequency is maintained by applying positive feedback to the film via this circuit. This new mode, which is a step towards more compact and parallel tapping mode AFM imaging, is demonstrated by imaging an evaporated gold film on a silicon substrate. A self-oscillating frequency spectrum and a force-distance curve are also presented.

  6. Surface modifications with Lissajous trajectories using atomic force microscopy

    International Nuclear Information System (INIS)

    In this paper, we report a method for atomic force microscopy surface modifications with single-tone and multiple-resolution Lissajous trajectories. The tip mechanical scratching experiments with two series of Lissajous trajectories were carried out on monolayer films. The scratching processes with two scan methods have been illustrated. As an application, the tip-based triboelectrification phenomenon on the silicon dioxide surface with Lissajous trajectories was investigated. The triboelectric charges generated within the tip rubbed area on the surface were characterized in-situ by scanning Kelvin force microscopy. This method would provide a promising and cost-effective approach for surface modifications and nanofabrication

  7. Shell evolution of atomic nuclei due to the tensor force

    International Nuclear Information System (INIS)

    Magic numbers and shell structure are extremely important for the study of atomic nuclei, as they determine the mass, the shape of surface, and the limit of the existence of nuclei, and have been considered to be universal over all nuclei, since Mayer and Jensen (1949). However, recent studies on exotic nuclei with large variations of proton or neutron numbers indicate that the changes of magic numbers and shell structure, i.e, shell evolution, arise due to nuclear forces, in particular the tensor force, demolishing this universality. We shall present an overview of such a paradigm shift emerging in exotic nuclei. (author)

  8. Imaging stability in force-feedback high-speed atomic force microscopy

    Energy Technology Data Exchange (ETDEWEB)

    Kim, Byung I., E-mail: ByungKim@boisestate.edu [Department of Physics, Boise State University, 1910 University Drive Boise, ID 83725-1570, United States of America (United States); Boehm, Ryan D. [Department of Physics, Boise State University, 1910 University Drive Boise, ID 83725-1570, United States of America (United States)

    2013-02-15

    We studied the stability of force-feedback high-speed atomic force microscopy (HSAFM) by imaging soft, hard, and biological sample surfaces at various applied forces. The HSAFM images showed sudden topographic variations of streaky fringes with a negative applied force when collected on a soft hydrocarbon film grown on a grating sample, whereas they showed stable topographic features with positive applied forces. The instability of HSAFM images with the negative applied force was explained by the transition between contact and noncontact regimes in the force–distance curve. When the grating surface was cleaned, and thus hydrophilic by removing the hydrocarbon film, enhanced imaging stability was observed at both positive and negative applied forces. The higher adhesive interaction between the tip and the surface explains the improved imaging stability. The effects of imaging rate on the imaging stability were tested on an even softer adhesive Escherichia coli biofilm deposited onto the grating structure. The biofilm and planktonic cell structures in HSAFM images were reproducible within the force deviation less than ∼0.5 nN at the imaging rate up to 0.2 s per frame, suggesting that the force-feedback HSAFM was stable for various imaging speeds in imaging softer adhesive biological samples. - Highlights: ► We investigated the imaging stability of force-feedback HSAFM. ► Stable–unstable imaging transitions rely on applied force and sample hydrophilicity. ► The stable–unstable transitions are found to be independent of imaging rate.

  9. Uncertainties in forces extracted from non-contact atomic force microscopy measurements by fitting of long-range background forces

    Directory of Open Access Journals (Sweden)

    Adam Sweetman

    2014-04-01

    Full Text Available In principle, non-contact atomic force microscopy (NC-AFM now readily allows for the measurement of forces with sub-nanonewton precision on the atomic scale. In practice, however, the extraction of the often desired ‘short-range’ force from the experimental observable (frequency shift is often far from trivial. In most cases there is a significant contribution to the total tip–sample force due to non-site-specific van der Waals and electrostatic forces. Typically, the contribution from these forces must be removed before the results of the experiment can be successfully interpreted, often by comparison to density functional theory calculations. In this paper we compare the ‘on-minus-off’ method for extracting site-specific forces to a commonly used extrapolation method modelling the long-range forces using a simple power law. By examining the behaviour of the fitting method in the case of two radically different interaction potentials we show that significant uncertainties in the final extracted forces may result from use of the extrapolation method.

  10. Detection of Elliptical Particles in Atomic Force Microscopy Images

    Czech Academy of Sciences Publication Activity Database

    Sedlář, Jiří; Zitová, Barbara; Kopeček, Jaromír; Todorciuc, T.; Kratochvílová, Irena

    Praha : IEEE, 2011, s. 1233-1236. ISBN 978-1-4577-0539-7. [ICASSP 2011: IEEE International Conference on Acoustics, Speech, and Signal Processing. Praha (CZ), 22.05.2011-27.05.2011] R&D Projects: GA MŠk 1M0572; GA ČR GA203/08/1594; GA AV ČR KAN401770651; GA ČR GAP103/11/1552 Institutional research plan: CEZ:AV0Z10750506; CEZ:AV0Z10100520 Keywords : particles detection * atomic force microscopy (AFM) imaging * watershed segmentation * image moments * approximation by ellipses Subject RIV: IN - Informatics, Computer Science http://library.utia.cas.cz/separaty/2011/ZOI/sedlar-detection of elliptical particles in atomic force microscopy image s.pdf

  11. Nanoindentation of gold nanorods with an atomic force microscope

    Science.gov (United States)

    Reischl, B.; Kuronen, A.; Nordlund, K.

    2014-12-01

    The atomic force microscope (AFM) can be used to measure mechanical properties of nanoscale objects, which are too small to be studied using a conventional nanoindenter. The contact mechanics at such small scales, in proximity of free surfaces, deviate substantially from simple continuum models. We present results from atomistic computer simulations of the indentation of gold nanorods using a diamond AFM tip and give insight in the atomic scale processes, involving creation and migration of dislocations, leading to the plastic deformation of the sample under load, and explain the force-distance curves observed for different tip apex radii of curvature, as well as different crystallographic structure and orientation of the gold nanorod samples.

  12. Independent analysis of mechanical data from atomic force microscopy

    International Nuclear Information System (INIS)

    Present atomic force microscopes are capable of acquiring large data volumes by point using point force–distance spectroscopic measurements. Even if different trade names and different technical implementations are used, for most of these techniques a force–distance curve in every image pixel is measured, this curve is immediately fitted by some theoretical dependence and results are displayed as a mechanical properties channel (Young modulus, adhesion, etc). Results are processed during the measurement directly in the scanning probe microscopy controller or, after it, by manufacturer provided software. In this paper, we present a software tool for independent numerical processing of such data, including more numerical models for the force–distance curve evaluation and including a simple estimate of uncertainties related to the fitting procedure. This can improve the reliability and the analytical possibilities of mechanical properties mapping methods in an atomic force microscopy. (paper)

  13. Dissipative binding of atoms by non-conservative forces

    CERN Document Server

    Lemeshko, Mikhail

    2013-01-01

    The formation of molecules and supramolecular structures results from bonding by conservative forces acting among electrons and nuclei and giving rise to equilibrium configurations defined by minima of the interaction potential. Here we show that bonding can also occur by the non-conservative forces responsible for interaction-induced coherent population trapping. The bound state arises in a dissipative process and manifests itself as a stationary state at a preordained interatomic distance. Remarkably, such a dissipative bonding is present even when the interactions among the atoms are purely repulsive. The dissipative bound states can be created and studied spectroscopically in present-day experiments with ultracold atoms or molecules and can potentially serve for cooling strongly interacting quantum gases.

  14. Atomic force microscopy in biomedical research - Methods and protocols

    Directory of Open Access Journals (Sweden)

    CarloAlberto Redi

    2011-11-01

    Full Text Available Pier Carlo Braga and Davide Ricci are old friends not only for those researchers familiar with Atomic force microscopy (AFM but also for those beginners (like the undersigned that already enthusiastically welcomed their 2004 edition (for the same Humana press printing types of Atomic force microscopy: Biomedical methods and applications, eventhough I never had used the AFM. That book was much intended to overview the possible AFM applications for a wide range of readers so that they can be in some way stimulated toward the AFM use. In fact, the great majority of scientists is afraid both of the technology behind AFM (that is naturally thought highly demanding in term of concepts not so familiar to biologists and physicians and of the financial costs: both these two factors are conceived unapproachable by the medium range granted scientist usually not educated in terms of biophysics and electronic background....

  15. Atomic force microscopy study of the early fatigue damage

    Czech Academy of Sciences Publication Activity Database

    Polák, Jaroslav; Man, Jiří; Obrtlík, Karel

    482 2005, - (2005), s. 45-50. ISSN 0255-5476. [Materials Structure and Micromechanics of Fracture. Brno, 23.06.2004-25.06.2004] R&D Projects: GA AV ČR(CZ) IAA2041201; GA AV ČR(CZ) IBS2041001 Institutional research plan: CEZ:AV0Z20410507 Keywords : Atomic force microscopy (AFM) * Fatigue damage * Extrusion, Intrusion Subject RIV: JG - Metallurgy Impact factor: 0.399, year: 2005

  16. Nonlinear Dynamics of Tapping Mode Atomic Force Microscopy

    OpenAIRE

    Bahrami, Arash

    2012-01-01

    A mathematical model is developed to investigate the grazing dynamics of tapping mode atomic force microscopes (AFM) subjected to a base harmonic excitation. The nonlinear dynamics of the AFM microcantilever are studied in both of the monostable and bistable phases with the microcantilever tip being, respectively, located in the monostable and bistable regions of the static bifurcation diagram in the reference configuration. Free-vibration responses of the AFM probes, including the microcanti...

  17. Probing stem cell differentiation using atomic force microscopy

    Science.gov (United States)

    Liang, Xiaobin; Shi, Xuetao; Ostrovidov, Serge; Wu, Hongkai; Nakajima, Ken

    2016-03-01

    A real-time method using atomic force microscopy (AFM) was developed to probe stem cell differentiation by measuring the mechanical properties of cells and the extracellular matrix (ECM). The mechanical properties of stem cells and their ECMs can be used to clearly distinguish specific stem cell-differentiated lineages. It is clear that AFM is a facile and useful tool for monitoring the differentiation of stem cells in a non-invasive manner.

  18. Atomic force microscopy investigations of peptide self-assembly

    OpenAIRE

    Sedman, Victoria L.

    2006-01-01

    The ability of short peptide fragments to self-assemble in isolation as amyloid and amyloid-like structures has prompted their use as model systems for the study of amyloid formation and recently also for their utilisation as novel nanofibrillar material. The atomic force microscope (AFM) is used here to investigate the self-assembly of two peptide systems and the development of strategies to directly manipulate and control the structures they form. The studies presented in Chapter 2 addr...

  19. Comparative study of clinical pulmonary surfactants using atomic force microscopy

    OpenAIRE

    Zhang, Hong; Fan, Qihui; Wang, Yi E.; Neal, Charles R.; Zuo, Yi Y.

    2011-01-01

    Clinical pulmonary surfactant is routinely used to treat premature newborns with respiratory distress syndrome, and has shown great potential in alleviating a number of neonatal and adult respiratory diseases. Despite extensive study of chemical composition, surface activity, and clinical performance of various surfactant preparations, a direct comparison of surfactant films is still lacking. In this study, we use atomic force microscopy to characterize and compare four animal-derived clinica...

  20. Atomic force microscopic study on lipid bilayer nanoscale phase separation

    OpenAIRE

    Liu, Rui

    2014-01-01

    Phase separation of copolymers or lipid membranes in nanoscale has attracted increasing interests for their applications in the synthesis of inorganic nanomaterial. The nanoscale phase separation of liquid bilayer as a supported membrane is systematically investigated by atomic force microscope (AFM). Moreover, the position of the fluorescence indicator, which is commonly used in the phase separation study in optical microscope, is also probed in this study to complete the knowledge of tradit...

  1. Superhard, conductive coatings for atomic force microscopy cantilevers

    OpenAIRE

    Ronning, Carsten; Wondratschek, Oliver; Büttner, Michael; Hofsäss, Hans Christian; Zimmermann, Jörg; Leiderer, Paul; Boneberg, Johannes

    2001-01-01

    Boron carbide thin films were grown by mass selected ion beam deposition using low energy 11B+ and 12C+ ions at room temperature. The amorphous films exhibit any desired stoichiometry controlled by the ion charge ratio B+/C+. Films with a stoichiometry of B4C showed the optimal combination of a high mechanical strength and a low electrical resistivity for the coating of atomic force microscopy (AFM) silicon cantilevers. The properties of such AFM tips were evaluated and simultaneous topograph...

  2. Investigating self-assembled protein nanotubes using atomic force microscopy

    OpenAIRE

    Niu, Lijiang

    2009-01-01

    Self-assembled protein nanotubular materials are attractive as putative building blocks for a variety of applications. Knowledge of the three-dimensional structures and the physical properties of these protein nanotubes then becomes a prerequisite for their use in rational materials design. The main purpose of the work presented in this thesis is to investigate both the structural and mechanical properties of protein nanotubes utilizing atomic force microscopy (AFM). Several different protein...

  3. Model based control of dynamic atomic force microscope

    International Nuclear Information System (INIS)

    A model-based robust control approach is proposed that significantly improves imaging bandwidth for the dynamic mode atomic force microscopy. A model for cantilever oscillation amplitude and phase dynamics is derived and used for the control design. In particular, the control design is based on a linearized model and robust H∞ control theory. This design yields a significant improvement when compared to the conventional proportional-integral designs and verified by experiments

  4. Demonstration of atomic scale stick-slip events stimulated by the force versus distance mode using atomic force microscopy

    Science.gov (United States)

    Watson, Gregory S.; Dinte, Bradley P.; Blach, Jolanta A.; Myhra, Sverre

    2002-08-01

    It has been shown that longitudinal deformation of the force-sensing/imposing lever can be stimulated by the conventional force versus distance (F-d), analytical mode of a scanning force microscope. Accordingly it is possible to measure simultaneously both in-plane and out-of-plane force components acting between a tip and a surface. Discrete atomic scale stick-slip events have been observed by F-d generated friction loop analysis of cleaved WTe2, Mica and HOPG single crystals, and of a Langmuir-Blodgett film. Due to the lever geometry, the lateral resolution arising from z-stage movement is better by an order of magnitude than that obtained from translation of the x-y-stage.

  5. Atomic Force Microscopy Application in Biological Research: A Review Study

    Directory of Open Access Journals (Sweden)

    Surena Vahabi

    2013-06-01

    Full Text Available Atomic force microscopy (AFM is a three-dimensional topographic technique with a high atomic resolution to measure surface roughness. AFM is a kind of scanning probe microscope, and its near-field technique is based on the interaction between a sharp tip and the atoms of the sample surface. There are several methods and many ways to modify the tip of the AFM to investigate surface properties, including measuring friction, adhesion forces and viscoelastic properties as well as determining the Young modulus and imaging magnetic or electrostatic properties. The AFM technique can analyze any kind of samples such as polymers, adsorbed molecules, films or fibers, and powders in the air whether in a controlled atmosphere or in a liquid medium. In the past decade, the AFM has emerged as a powerful tool to obtain the nanostructural details and biomechanical properties of biological samples, including biomolecules and cells. The AFM applications, techniques, and -in particular- its ability to measure forces, are not still familiar to most clinicians. This paper reviews the literature on the main principles of the AFM modality and highlights the advantages of this technique in biology, medicine, and- especially- dentistry. This literature review was performed through E-resources, including Science Direct, PubMed, Blackwell Synergy, Embase, Elsevier, and Scholar Google for the references published between 1985 and 2010.

  6. Cooperative scattering and radiation pressure force in dense atomic clouds

    International Nuclear Information System (INIS)

    Atomic clouds prepared in ''timed Dicke'' states, i.e. states where the phase of the oscillating atomic dipole moments linearly varies along one direction of space, are efficient sources of superradiant light emission [Scully et al., Phys. Rev. Lett. 96, 010501 (2006)]. Here, we show that, in contrast to previous assertions, timed Dicke states are not the states automatically generated by incident laser light. In reality, the atoms act back on the driving field because of the finite refraction of the cloud. This leads to nonuniform phase shifts, which, at higher optical densities, dramatically alter the cooperative scattering properties, as we show by explicit calculation of macroscopic observables, such as the radiation pressure force.

  7. Imaging stability in force-feedback high-speed atomic force microscopy.

    Science.gov (United States)

    Kim, Byung I; Boehm, Ryan D

    2013-02-01

    We studied the stability of force-feedback high-speed atomic force microscopy (HSAFM) by imaging soft, hard, and biological sample surfaces at various applied forces. The HSAFM images showed sudden topographic variations of streaky fringes with a negative applied force when collected on a soft hydrocarbon film grown on a grating sample, whereas they showed stable topographic features with positive applied forces. The instability of HSAFM images with the negative applied force was explained by the transition between contact and noncontact regimes in the force-distance curve. When the grating surface was cleaned, and thus hydrophilic by removing the hydrocarbon film, enhanced imaging stability was observed at both positive and negative applied forces. The higher adhesive interaction between the tip and the surface explains the improved imaging stability. The effects of imaging rate on the imaging stability were tested on an even softer adhesive Escherichia coli biofilm deposited onto the grating structure. The biofilm and planktonic cell structures in HSAFM images were reproducible within the force deviation less than ∼0.5 nN at the imaging rate up to 0.2s per frame, suggesting that the force-feedback HSAFM was stable for various imaging speeds in imaging softer adhesive biological samples. PMID:23274682

  8. Investigation of penetration force of living cell using an atomic force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Kwon, Eun Young; Kim, Young Tae; Kim, Dae Eun [Yonsei University, Seoul (Korea, Republic of)

    2009-07-15

    Recently, the manipulation of a single cell has been receiving much attention in transgenesis, in-vitro fertilization, individual cell based diagnosis, and pharmaceutical applications. As these techniques require precise injection and manipulation of cells, issues related to penetration force arise. In this work the penetration force of living cell was studied using an atomic force microscope (AFM). L929, HeLa, 4T1, and TA3 HA II cells were used for the experiments. The results showed that the penetration force was in the range of 2{approx}22 nN. It was also found that location of cell penetration and stiffness of the AFM cantilever affected the penetration force significantly. Furthermore, double penetration events could be detected, due to the multi-membrane layers of the cell. The findings of this work are expected to aid in the development of precision micro-medical instruments for cell manipulation and treatment

  9. Friction force measurements relevant to de-inking by means of atomic force microscope.

    Science.gov (United States)

    Theander, Katarina; Pugh, Robert J; Rutland, Mark W

    2005-11-15

    In the pulping step of the de-inking process, the ink detaches from the fibers due to shear and physical chemical interaction. In order to get a better understanding of the forces involved between cellulose and ink, the atomic force microscope and the colloidal probe technique have been used in the presence of a model chemical dispersant (hexa-ethyleneglycol mono n-dodecyl ether, C12E6). A cellulose bead was used as the colloidal probe and three different lower surfaces have been used, an alkyd resin, mica and a cellulose sphere. The normal and lateral forces have been measured at a range of nonionic concentrations. It was found that the lateral sliding friction forces deceased with increasing surfactant concentration for both the alkyd resin and mica while no differences were observed for the cellulose surface. In addition, only a very small change in normal force could be detected for the alkyd surface as the concentration changed. PMID:15961095

  10. Advances in Atomic Force Microscopy and Scanning Tunneling Microscopy

    Science.gov (United States)

    Albrecht, Thomas Robert

    The scanning tunneling microscope (STM) and the more recently developed atomic force microscope (AFM) are high resolution scanning probe microscopes capable of three dimensional atomic-scale surface profiling. In the AFM, minute forces acting between the tip of a flexible cantilever stylus and the surface of the sample cause deflections of the cantilever which are detected by a tunneling or optical sensor with subangstrom sensitivity. The AFM work presented here involves surface profiling via repulsive contact forces between 10^{-6} and 10^{-9} N in magnitude. In this contact profiling (repulsive) mode the AFM is capable of atomic resolution on both electrically conducting and insulating surfaces (unlike the STM). AFM instrumentation for room temperature and low temperature operation is discussed. The critical component of the AFM is the cantilever stylus assembly, which should have a small mass. Several microfabrication processes have been developed to produce thin film SiO_2 and Si_3N_4 microcantilevers with integrated sharp tips. Atomic resolution has been achieved with the AFM in air on a number of samples, including graphite, MoS _2, TaSe_2, WTe_2, TaS_2, and BN (the first insulator imaged with atomic resolution by any means). Various organic and molecular samples have been imaged with nanometer resolution. The difference between STM and AFM response is shown in images of TaS _2 (a charge density wave material), and in simultaneous STM/AFM images of lattice defects and adsorbates on graphite and MoS_2. A number of artifacts make STM and AFM image interpretation subtle, such as tip shape effects, frictional effects, and tracking in atomic grooves. STM images of moire patterns near grain boundaries confirm the importance of tip shape effects. Various surface modification and lithography techniques have been demonstrated with the STM and AFM, including an STM voltage pulse technique which reproducibly creates 40 A diameter holes on the surface of graphite, and a

  11. Hierarchical atom type definitions and extensible all-atom force fields.

    Science.gov (United States)

    Jin, Zhao; Yang, Chunwei; Cao, Fenglei; Li, Feng; Jing, Zhifeng; Chen, Long; Shen, Zhe; Xin, Liang; Tong, Sijia; Sun, Huai

    2016-03-15

    The extensibility of force field is a key to solve the missing parameter problem commonly found in force field applications. The extensibility of conventional force fields is traditionally managed in the parameterization procedure, which becomes impractical as the coverage of the force field increases above a threshold. A hierarchical atom-type definition (HAD) scheme is proposed to make extensible atom type definitions, which ensures that the force field developed based on the definitions are extensible. To demonstrate how HAD works and to prepare a foundation for future developments, two general force fields based on AMBER and DFF functional forms are parameterized for common organic molecules. The force field parameters are derived from the same set of quantum mechanical data and experimental liquid data using an automated parameterization tool, and validated by calculating molecular and liquid properties. The hydration free energies are calculated successfully by introducing a polarization scaling factor to the dispersion term between the solvent and solute molecules. © 2015 Wiley Periodicals, Inc. PMID:26537332

  12. Is atomic-scale dissipation in NC-AFM real? Investigation using virtual atomic force microscopy

    International Nuclear Information System (INIS)

    Using a virtual dynamic atomic force microscope, that explicitly simulates the operation of a non-contact AFM experiment, we have performed calculations to investigate the formation of atomic-scale contrast in dissipation images. A non-conservative tip-surface interaction was implemented using the theory of dynamical response in scanning probe microscopy with energies and barriers derived from realistic atomistic modelling. It is shown how contrast in the damping signal is due to the hysteresis in the tip-surface force and not an artefact of the finite response of the complicated instrumentation. Topography and dissipation images of the CaO(001) surface are produced which show atomic-scale contrast in the dissipation with a corrugation of approximately 0.1 eV, which is typical of that observed in images of similar binary ionic surfaces. The effect of the fast-direction scanning speed on the image formation is also investigated and discussed

  13. Characterization of new drug delivery nanosystems using atomic force microscopy

    Science.gov (United States)

    Spyratou, Ellas; Mourelatou, Elena A.; Demetzos, C.; Makropoulou, Mersini; Serafetinides, A. A.

    2015-01-01

    Liposomes are the most attractive lipid vesicles for targeted drug delivery in nanomedicine, behaving also as cell models in biophotonics research. The characterization of the micro-mechanical properties of drug carriers is an important issue and many analytical techniques are employed, as, for example, optical tweezers and atomic force microscopy. In this work, polyol hyperbranched polymers (HBPs) have been employed along with liposomes for the preparation of new chimeric advanced drug delivery nanosystems (Chi-aDDnSs). Aliphatic polyester HBPs with three different pseudogenerations G2, G3 and G4 with 16, 32, and 64 peripheral hydroxyl groups, respectively, have been incorporated in liposomal formulation. The atomic force microscopy (AFM) technique was used for the comparative study of the morphology and the mechanical properties of Chi-aDDnSs and conventional DDnS. The effects of both the HBPs architecture and the polyesters pseudogeneration number in the stability and the stiffness of chi-aDDnSs were examined. From the force-distance curves of AFM spectroscopy, the Young's modulus was calculated.

  14. Localization and force analysis at the single virus particle level using atomic force microscopy

    International Nuclear Information System (INIS)

    Highlights: ► Localization of single virus particle. ► Force measurements. ► Force mapping. -- Abstract: Atomic force microscopy (AFM) is a vital instrument in nanobiotechnology. In this study, we developed a method that enables AFM to simultaneously measure specific unbinding force and map the viral glycoprotein at the single virus particle level. The average diameter of virus particles from AFM images and the specificity between the viral surface antigen and antibody probe were integrated to design a three-stage method that sets the measuring area to a single virus particle before obtaining the force measurements, where the influenza virus was used as the object of measurements. Based on the purposed method and performed analysis, several findings can be derived from the results. The mean unbinding force of a single virus particle can be quantified, and no significant difference exists in this value among virus particles. Furthermore, the repeatability of the proposed method is demonstrated. The force mapping images reveal that the distributions of surface viral antigens recognized by antibody probe were dispersed on the whole surface of individual virus particles under the proposed method and experimental criteria; meanwhile, the binding probabilities are similar among particles. This approach can be easily applied to most AFM systems without specific components or configurations. These results help understand the force-based analysis at the single virus particle level, and therefore, can reinforce the capability of AFM to investigate a specific type of viral surface protein and its distributions.

  15. Taking nanomedicine teaching into practice with atomic force microscopy and force spectroscopy.

    Science.gov (United States)

    Carvalho, Filomena A; Freitas, Teresa; Santos, Nuno C

    2015-12-01

    Atomic force microscopy (AFM) is a useful and powerful tool to study molecular interactions applied to nanomedicine. The aim of the present study was to implement a hands-on atomic AFM course for graduated biosciences and medical students. The course comprises two distinct practical sessions, where students get in touch with the use of an atomic force microscope by performing AFM scanning images of human blood cells and force spectroscopy measurements of the fibrinogen-platelet interaction. Since the beginning of this course, in 2008, the overall rating by the students was 4.7 (out of 5), meaning a good to excellent evaluation. Students were very enthusiastic and produced high-quality AFM images and force spectroscopy data. The implementation of the hands-on AFM course was a success, giving to the students the opportunity of contact with a technique that has a wide variety of applications on the nanomedicine field. In the near future, nanomedicine will have remarkable implications in medicine regarding the definition, diagnosis, and treatment of different diseases. AFM enables students to observe single molecule interactions, enabling the understanding of molecular mechanisms of different physiological and pathological processes at the nanoscale level. Therefore, the introduction of nanomedicine courses in bioscience and medical school curricula is essential. PMID:26628660

  16. Potential contributions of noncontact atomic force microscopy for the future Casimir force measurements

    CERN Document Server

    Kim, W J

    2010-01-01

    Surface electric noise, i.e., the non-uniform distribution of charges and potentials on a surface, poses a great experimental challenge in modern precision force measurements. Such a challenge is encountered in a number of different experimental circumstances. The scientists employing atomic force microscopy (AFM) have long focused their efforts to understand the surface-related noise issues via variants of AFM techniques, such as Kelvin probe force microscopy or electric force microscopy. Recently, the physicists investigating quantum vacuum fluctuation phenomena between two closely-spaced objects have also begun to collect experimental evidence indicating a presence of surface effects neglected in their previous analyses. It now appears that the two seemingly disparate science communities are encountering effects rooted in the same surface phenomena. In this report, we suggest specific experimental tasks to be performed in the near future that are crucial not only for fostering needed collaborations between...

  17. Combined atomic force microscopy and voltage pulse technique to accurately measure electrostatic force

    Science.gov (United States)

    Inami, Eiichi; Sugimoto, Yoshiaki

    2016-08-01

    We propose a new method of extracting electrostatic force. The technique is based on frequency modulation atomic force microscopy (FM-AFM) combined with a voltage pulse. In this method, the work that the electrostatic field does on the oscillating tip is measured through the cantilever energy dissipation. This allows us to directly extract capacitive forces including the longer range part, to which the conventional FM-AFM is insensitive. The distance-dependent contact potential difference, which is modulated by local charges distributed on the surfaces of the tip and/or sample, could also be correctly obtained. In the absence of local charges, our method can perfectly reproduce the electrostatic force as a function of the distance and the bias voltage. Furthermore, we demonstrate that the system serves as a sensitive sensor enabling us to check the existence of the local charges such as trapped charges and patch charges.

  18. On averaging force curves over heterogeneous surfaces in atomic force microscopy

    Energy Technology Data Exchange (ETDEWEB)

    Sokolov, I., E-mail: sokolov@clarkson.edu [Department of Physics, Clarkson University, Potsdam, NY 13699 (United States); Nanoengineering and Biotechnology Laboratories Center (NABLAB), Clarkson University, NY 13699 (United States); Kalaparthi, V.; Kreshchuk, M.; Dokukin, M.E. [Department of Physics, Clarkson University, Potsdam, NY 13699 (United States)

    2012-10-15

    Atomic force microscopy (AFM) can be used to study mechanics at the nanoscale. Biological surfaces and nanocomposites have typically heterogeneous surfaces, both mechanically and chemically. When studying such surfaces with AFM, one needs to collect a large amount of data to make statistically sound conclusions. It is time- and resource-consuming to process each force curve separately. The analysis of an averaged raw force data is a simple and time saving option, which also averages out the noise and measurement artifacts of the force curves being analyzed. Moreover, some biomedical applications require just an average number per biological cell. Here we investigate such averaging, study the possible artifacts due to the averaging, and demonstrate how to minimize or even to avoid them. We analyze two ways of doing the averaging: over the force data for each particular distance (method 1, the most commonly used way), and over the distances for each particular force (method 2). We derive the errors of the methods in finding to the true average rigidity modulus. We show that both methods are accurate (the error is <2%) when the heterogeneity of the surface rigidity is small (<50%). When the heterogeneity is large (>100 Multiplication-Sign ), method 2 underestimates the average rigidity modulus by a factor of 2, whereas the error of method 1 is only 15%. However, when analyzing the different surface chemistry, which reveals itself in the changing long-range forces, the accuracy of the methods behave oppositely: method 1 can produce a noticeable averaging artifact in the deriving of the long-range forces; whereas method 2 can be successfully used to derive the averaged long-range force parameters without artifacts. We exemplify our conclusions by the study of human cervical cancer and normal epithelial cells, which demonstrate different degrees of heterogeneity. -- Highlights: Black-Right-Pointing-Pointer Long-range force can be measured with atomic force microscopy

  19. Diagonal control design for atomic force microscope piezoelectric tube nanopositioners.

    Science.gov (United States)

    Bhikkaji, B; Yong, Y K; Mahmood, I A; Moheimani, S O R

    2013-02-01

    Atomic Force Microscopes (AFM) are used for generating surface topography of samples at micro to atomic resolutions. Many commercial AFMs use piezoelectric tube nanopositioners for scanning. Scanning rates of these microscopes are hampered by the presence of low frequency resonant modes. When inadvertently excited, these modes lead to high amplitude mechanical vibrations causing the loss of accuracy, while scanning, and eventually to break down of the tube. Feedback control has been used to damp these resonant modes. Thereby, enabling higher scanning rates. Here, a multivariable controller is designed to damp the first resonant mode along both the x and y axis. Exploiting the inherent symmetry in the piezoelectric tube, the multivariable control design problem is recast as independent single-input single-output (SISO) designs. This in conjunction with integral resonant control is used for damping the first resonant mode. PMID:23464216

  20. Atomic force microscopy based approach to local impedance measurements of grain interiors and grain boundaries of sensitized AISI 304 stainless steel

    International Nuclear Information System (INIS)

    The paper presents the results of the AFM based approach to local impedance spectroscopy (LIS) measurements performed within the region of austenite grain interiors and the austenite grain boundaries for both sensitized and non-sensitized AISI 304 stainless steel (SS). The local impedance investigations in the AFM contact mode were carried out after standard tests for susceptibility to intergranular corrosion (IGC). Local impedance spectra recorded in the AFM contact mode for both sensitized and non-sensitized AISI 304 stainless steel within the region of the austenite grain interiors and the austenite grain boundaries demonstrated different shapes and characters. Performed researches revealed significant differences in the charge transfer resistance values recorded for the austenite grain interiors and the grain boundaries depending on the sensitization state. Moreover, proposed AFM based approach allows identification of the IGC process even when a double-loop electrochemical potentiokinetic reactivation (DL-EPR) method does not provide evidence of it.

  1. Visualisation of xanthan conformation by atomic force microscopy.

    Science.gov (United States)

    Moffat, Jonathan; Morris, Victor J; Al-Assaf, Saphwan; Gunning, A Patrick

    2016-09-01

    Direct visual evidence obtained by atomic force microscopy demonstrates that when xanthan is adsorbed from aqueous solution onto the heterogeneously charged substrate mica, its helical conformation is distorted. Following adsorption it requires annealing for several hours to restore its ordered helical state. Once the helix state reforms, the AFM images obtained showed clear resolution of the periodicity with a value of 4.7nm consistent with the previously predicted models. In addition, the images also reveal evidence that the helix is formed by a double strand, a clarification of an ambiguity of the xanthan ultrastructure that has been outstanding for many years. PMID:27185152

  2. Cryo-atomic force microscopy of smooth muscle myosin.

    OpenAIRE

    Y. Zhang; Shao, Z; Somlyo, A. P.; Somlyo, A V

    1997-01-01

    The motor and regulatory domains of the head and the 14-nm pitch of the alpha-helical coiled-coil of the tail of extended (6S) smooth-muscle myosin molecules were imaged with cryo atomic force microscopy at 80-85 K, and the effects of thiophosphorylation of the regulatory light chain were examined. The tail was 4 nm shorter in thiophosphorylated than in nonphosphorylated myosin. The first major bend was invariant, at approximately 51 nm from the head-tail junction (H-T), coincident with low p...

  3. Atomic force microscope characterization of a resonating nanocantilever

    DEFF Research Database (Denmark)

    Abadal, G.; Davis, Zachary James; Borrise, X.; Hansen, Ole; Boisen, Anja; Barniol, N.; Perez-Murano, F.; Serra, F.

    An atomic force microscope (AFM) is used as a nanometer-scale resolution tool for the characterization of the electromechanical behaviour of a resonant cantilever-based mass sensor. The cantilever is actuated electrostatically by applying DC and AC voltages from a driver electrode placed closely...... and of the oscillation amplitude on the frequency of the AC voltage is measured by this technique and the results are fitted by a simple non-linear electromechanical model. (C) 2003 Elsevier Science B.V. All rights reserved....

  4. Microstructural Characterization of Hierarchical Structured Surfaces by Atomic Force Microscopy

    Science.gov (United States)

    Ponomareva, A. A.; Moshnikov, V. A.; Suchaneck, G.

    2013-12-01

    In this work, we evaluate the hierarchical surface topography of reactively sputtered nanocrystalline Pb(Zr,Ti)O3 and TiO2 thin films as well as plasma-treated antireflective PET films by means of determining the fractal dimension and power spectral density (PSD) of surface topography recorded by atomic force microscopy (AFM). Local fractal dimension was obtained using the triangulation method. The PSDs of all samples were fitted to the k-correlation model (also called ABC model) valid for a self-affine surface topography. Fractal analysis of AFM images was shown to be an appropriate and easy to use tool for the characterization of hierarchical nanostructures.

  5. CO tip functionalization in subatomic resolution atomic force microscopy

    International Nuclear Information System (INIS)

    Noncontact atomic force microscopy (nc-AFM) employing a CO-functionalized tip displays dramatically enhanced resolution wherein covalent bonds of polycyclic aromatic hydrocarbon can be imaged. Employing real-space pseudopotential first-principles calculations, we examine the role of CO in functionalizing the nc-AFM tip. Our calculations allow us to simulate full AFM images and ascertain the enhancement mechanism of the CO molecule. We consider two approaches: one with an explicit inclusion of the CO molecule and one without. By comparing our simulations to existing experimental images, we ascribe the enhanced resolution of the CO functionalized tip to the special orbital characteristics of the CO molecule

  6. Design of cantilever probes for Atomic Force Microscopy (AFM)

    DEFF Research Database (Denmark)

    Pedersen, Niels Leergaard

    2000-01-01

    A cantilever beam used in an Atomic Force Microscope is optimized with respect to two different objectives. The first goal is to maximize the first eigenfrequency while keeping the stiffness of the probe constant. The second goal is to maximize the tip angle of the first eigenmode while again...... keeping the stiffness constant. The resulting design of the beam from the latter optimization gives almost the same result as when maximizing the first eigenfrequency. Adding a restriction on the second eigenfrequency result in a significant change of the optimal design. The beam is modelled with 12 DOF...

  7. High-speed atomic force microscopy coming of age

    International Nuclear Information System (INIS)

    High-speed atomic force microscopy (HS-AFM) is now materialized. It allows direct visualization of dynamic structural changes and dynamic processes of functioning biological molecules in physiological solutions, at high spatiotemporal resolution. Dynamic molecular events unselectively appear in detail in an AFM movie, facilitating our understanding of how biological molecules operate to function. This review describes a historical overview of technical development towards HS-AFM, summarizes elementary devices and techniques used in the current HS-AFM, and then highlights recent imaging studies. Finally, future challenges of HS-AFM studies are briefly discussed. (topical review)

  8. High-speed atomic force microscopy coming of age

    Science.gov (United States)

    Ando, Toshio

    2012-02-01

    High-speed atomic force microscopy (HS-AFM) is now materialized. It allows direct visualization of dynamic structural changes and dynamic processes of functioning biological molecules in physiological solutions, at high spatiotemporal resolution. Dynamic molecular events unselectively appear in detail in an AFM movie, facilitating our understanding of how biological molecules operate to function. This review describes a historical overview of technical development towards HS-AFM, summarizes elementary devices and techniques used in the current HS-AFM, and then highlights recent imaging studies. Finally, future challenges of HS-AFM studies are briefly discussed.

  9. Thermal writing using a heated atomic force microscope tip

    Science.gov (United States)

    Mamin, H. J.

    1996-07-01

    Resistive heating of an atomic force microscope tip was used to perform thermally induced surface modifications. Heating was achieved by dissipating power in the legs of an electrically conducting silicon cantilever. Temperatures of up to 170 °C were obtained using 40 mW of input power. Electrical measurements used to monitor the temperature showed thermal time constants of 0.35-0.45 ms, depending on whether the tip was in contact with a substrate. The heated tip was used to demonstrate thermomechanical writing on a polycarbonate substrate, as well as thermal writing of an optical phase change material.

  10. Manipulation of single magnetic protein particles using atomic force microscopy

    International Nuclear Information System (INIS)

    Horse-spleen ferritin has recently gained much attention as a nanoscale magnet that demonstrates macroscopic quantum tunneling of its magnetization through the anisotropy barrier. The size of the protein is ideal for the identification and manipulation of single particles using scanned-probe techniques. We demonstrate that accurate positioning of individual, surface-trapped horse-spleen particles can be achieved by mechanical pushing with the tip of an atomic force microscope. This technique offers a route to the incorporation of single ferritin particles as components in future nanoscale devices

  11. Nanoindentation of Pseudomonas aeruginosa bacterial biofilm using atomic force microscopy

    Science.gov (United States)

    Baniasadi, Mahmoud; Xu, Zhe; Gandee, Leah; Du, Yingjie; Lu, Hongbing; Zimmern, Philippe; Minary-Jolandan, Majid

    2014-12-01

    Bacterial biofilms are a source of many chronic infections. Biofilms and their inherent resistance to antibiotics are attributable to a range of health issues including affecting prosthetic implants, hospital-acquired infections, and wound infection. Mechanical properties of biofilm, in particular, at micro- and nano-scales, are governed by microstructures and porosity of the biofilm, which in turn may contribute to their inherent antibiotic resistance. We utilize atomic force microscopy (AFM)-based nanoindentation and finite element simulation to investigate the nanoscale mechanical properties of Pseudomonas aeruginosa bacterial biofilm. This biofilm was derived from human samples and represents a medically relevant model.

  12. Understanding the Plasmonics of Nanostructured Atomic Force Microscopy Tips

    CERN Document Server

    Sanders, Alan; Zhang, Liwu; Turek, Vladimir; Sigle, Daniel O; Lombardi, Anna; Weller, Lee; Baumberg, Jeremy J

    2016-01-01

    Structured metallic tips are increasingly important for optical spectroscopies such as tip-enhanced Raman spectroscopy (TERS), with plasmonic resonances frequently cited as a mechanism for electric field enhancement. We probe the local optical response of sharp and spherical-tipped atomic force microscopy (AFM) tips using a scanning hyperspectral imaging technique to identify plasmonic behaviour. Localised surface plasmon resonances which radiatively couple with far-field light are found only for spherical AFM tips, with little response for sharp AFM tips, in agreement with numerical simulations of the near-field response. The precise tip geometry is thus crucial for plasmon-enhanced spectroscopies, and the typical sharp cones are not preferred.

  13. Microstructural Characterization of Hierarchical Structured Surfaces by Atomic Force Microscopy

    International Nuclear Information System (INIS)

    In this work, we evaluate the hierarchical surface topography of reactively sputtered nanocrystalline Pb(Zr,Ti)O3 and TiO2 thin films as well as plasma-treated antireflective PET films by means of determining the fractal dimension and power spectral density (PSD) of surface topography recorded by atomic force microscopy (AFM). Local fractal dimension was obtained using the triangulation method. The PSDs of all samples were fitted to the k-correlation model (also called ABC model) valid for a self-affine surface topography. Fractal analysis of AFM images was shown to be an appropriate and easy to use tool for the characterization of hierarchical nanostructures

  14. Scanned-cantilever atomic force microscope with large scanning range

    Institute of Scientific and Technical Information of China (English)

    Jintao Yang; Wendong Xu

    2006-01-01

    A scanned-cantilever atomic force microscope (AFM) with large scanning range is proposed, which adopts a new design named laser spot tracking. The scanned-cantilever AFM uses the separate flexure x-y scanner and z scanner instead of the conventional piezoelectric tube scanner. The closed-loop control and integrated capacitive sensors of these scanners can insure that the images of samples have excellent linearity and stability. According to the experimental results, the scanned-cantilever AFM can realize maximal 100 × 100 (μm) scanning range, and 1-nm resolution in z direction, which can meet the requirements of large scale sample testing.

  15. Nonlinear control techniques for an atomic force microscope system

    Institute of Scientific and Technical Information of China (English)

    Yongchun FANG; Matthew FEEMSTER; Darren DAWSON; Nader M.JALILI

    2005-01-01

    Two nonlinear control techniques are proposed for an atomic force microscope system.Initially,a learning-based control algorithm is developed for the microcantilever-sample system that achieves asymptotic cantilever tip tracking for periodic trajectories.Specifically,the control approach utilizes a learning-based feedforward term to compensate for periodic dynamics and high-gain terms to account for non-periodic dynamics.An adaptive control algorithm is then developed to achieve asymptotic cantilever tip tracking for bounded tip trajectories despite uncertainty throughout the system parameters.Simulation results are provided to illustrate the efficacy and performance of the control strategies.

  16. CO tip functionalization in subatomic resolution atomic force microscopy

    Energy Technology Data Exchange (ETDEWEB)

    Kim, Minjung [Department of Chemical Engineering, The University of Texas at Austin, Austin, Texas 78712 (United States); Chelikowsky, James R. [Center for Computational Materials, Institute for Computational Engineering and Sciences, and Departments of Physics and Chemical Engineering, The University of Texas at Austin, Austin, Texas 78712 (United States)

    2015-10-19

    Noncontact atomic force microscopy (nc-AFM) employing a CO-functionalized tip displays dramatically enhanced resolution wherein covalent bonds of polycyclic aromatic hydrocarbon can be imaged. Employing real-space pseudopotential first-principles calculations, we examine the role of CO in functionalizing the nc-AFM tip. Our calculations allow us to simulate full AFM images and ascertain the enhancement mechanism of the CO molecule. We consider two approaches: one with an explicit inclusion of the CO molecule and one without. By comparing our simulations to existing experimental images, we ascribe the enhanced resolution of the CO functionalized tip to the special orbital characteristics of the CO molecule.

  17. An atomic force microscope tip as a light source

    OpenAIRE

    Lulevich, V.; Honig, Christopher D. F.; Ducker, William A.

    2005-01-01

    We present a simple method for causing the end of a silicon nitride atomic force microscope (AFM) tip to emit light, and we use this emitted light to perform scanning near-field optical microscopy. Illumination of a silicon nitride AFM tip by blue (488 nm) or green (532 nm) laser light causes the sharp part of the tip to emit orange light. Orange light is emitted when the tip is immersed in either air or water; and while under illumination, emission continues for a period of many hours withou...

  18. Nanoindentation of Pseudomonas aeruginosa bacterial biofilm using atomic force microscopy

    International Nuclear Information System (INIS)

    Bacterial biofilms are a source of many chronic infections. Biofilms and their inherent resistance to antibiotics are attributable to a range of health issues including affecting prosthetic implants, hospital-acquired infections, and wound infection. Mechanical properties of biofilm, in particular, at micro- and nano-scales, are governed by microstructures and porosity of the biofilm, which in turn may contribute to their inherent antibiotic resistance. We utilize atomic force microscopy (AFM)-based nanoindentation and finite element simulation to investigate the nanoscale mechanical properties of Pseudomonas aeruginosa bacterial biofilm. This biofilm was derived from human samples and represents a medically relevant model. (paper)

  19. Single xanthan molecule preparation and atomic force microscopy observation

    International Nuclear Information System (INIS)

    A newly developed sample preparation technique termed multi-step spin-coating method was used to prepare well-dispersed xanthan molecules on bare mica, 3-aminopropyl triethoxysilane treated mica, nickel ion treated mica and highly oriented pyrolytic graphite, which are widely used as supporting surfaces in the atomic force microscopy (AFM) study. The substrate effects on conformation of single xanthan molecules were also investigated. We believe that this study is of great importance for the in-depth studies on xanthan molecules at the single-molecular level. (authors)

  20. Microtensile Tests Using In Situ Atomic Force Microscopy

    Science.gov (United States)

    Lang, Udo; Dual, Jurg

    In recent years a new field in the micromechanical characterization of materials has emerged. Researchers started to integrate atomic force microscopes (AFM) into microtensile tests. This allowed to investigate surface deformation of layers with thicknesses in the range of micrometers. In the first part of this article experiments on organic samples are presented followed by developments on anorganic specimens. In the second part of the paper latest developments at the Center of Mechanics of ETH Zurich are presented. The setup allows to monitor crack growth with micrometer resolution. At the same time forces can be measured in the millinewton range. Specimens are made from photodefinable polyimide. The stress-crack- length diagrams of two experiments are presented which enables to identify different stages of crack growth and therefore of fracture behaviour. Finally, possible extensions of the setup employing digital image correlation (DIC) are envisioned by analyzing the displacement field around the crack tip.

  1. Contrast artifacts in tapping tip atomic force microscopy

    DEFF Research Database (Denmark)

    Kyhle, Anders; Sørensen, Alexis Hammer; Zandbergen, Julie Bjerring; Bohr, Jakob

    When recording images with an atomic force microscope using the resonant vibrating cantilever mode, surprising strange results are often achieved. Typical artifacts are strange contours, unexpected height shifts, and sudden changes of the apparent resolution in the acquired images. Such artifacts...... can be related to the dynamical properties of the cantilever under the influence of the force between the tip and the sample. The damping of the cantilever oscillation can be either due to attractive interaction between the tip and the sample or due to a combination of attractive and repulsive...... interaction. The oscillating cantilever will be in a specific swing mode according to which type of interaction is dominating, and it is the switching between these modes that is responsible for a range of artifacts observed during image acquisition. This includes the artifact often referred to as "contrast...

  2. Potential role of atomic force microscopy in systems biology.

    Science.gov (United States)

    Ramachandran, Srinivasan; Teran Arce, Fernando; Lal, Ratnesh

    2011-01-01

    Systems biology is a quantitative approach for understanding a biological system at its global level through systematic perturbation and integrated analysis of all its components. Simultaneous acquisition of information data sets pertaining to the system components (e.g., genome, proteome) is essential to implement this approach. There are limitations to such an approach in measuring gene expression levels and accounting for all proteins in the system. The success of genomic studies is critically dependent on polymerase chain reaction (PCR) for its amplification, but PCR is very uneven in amplifying the samples, ineffective in scarce samples and unreliable in low copy number transcripts. On the other hand, lack of amplifying techniques for proteins critically limits their identification to only a small fraction of high concentration proteins. Atomic force microscopy (AFM), AFM cantilever sensors, and AFM force spectroscopy in particular, could address these issues directly. In this article, we reviewed and assessed their potential role in systems biology. PMID:21766465

  3. Determination of hydration film thickness using atomic force microscopy

    Institute of Scientific and Technical Information of China (English)

    PENG Changsheng; SONG Shaoxian; GU Qingbao

    2005-01-01

    Dispersion of a solid particle in water may lead to the formation of hydration film on the particle surface, which can strongly increase the repulsive force between the particles and thus strongly affect the stability of dispersions. The hydration film thickness, which varies with the variation of property of suspension particles, is one of the most important parameters of hydration film, and is also one of the most difficult parameters that can be measured accurately. In this paper, a method, based on force-distance curve of atomic force microscopy, for determining the hydration film thickness of particles is developed. The method utilizes the difference of cantilever deflection before, between and after penetrating the hydration films between tip and sample, which reflect the difference of slope on the force-distance curve. 3 samples, mica, glass and stainless steel, were used for hydration thickness determination, and the results show that the hydration film thickness between silicon tip and mica, glass and stainless steel are 30.0(2.0, 29.0(1.0 and 32.5(2.5 nm, respectively.

  4. High resolution atomic force microscopy of double-stranded RNA

    Science.gov (United States)

    Ares, Pablo; Fuentes-Perez, Maria Eugenia; Herrero-Galán, Elías; Valpuesta, José M.; Gil, Adriana; Gomez-Herrero, Julio; Moreno-Herrero, Fernando

    2016-06-01

    Double-stranded (ds) RNA mediates the suppression of specific gene expression, it is the genetic material of a number of viruses, and a key activator of the innate immune response against viral infections. The ever increasing list of roles played by dsRNA in the cell and its potential biotechnological applications over the last decade has raised an interest for the characterization of its mechanical properties and structure, and that includes approaches using Atomic Force Microscopy (AFM) and other single-molecule techniques. Recent reports have resolved the structure of dsDNA with AFM at unprecedented resolution. However, an equivalent study with dsRNA is still lacking. Here, we have visualized the double helix of dsRNA under near-physiological conditions and at sufficient resolution to resolve the A-form sub-helical pitch periodicity. We have employed different high-sensitive force-detection methods and obtained images with similar spatial resolution. Therefore, we show here that the limiting factors for high-resolution AFM imaging of soft materials in liquid medium are, rather than the imaging mode, the force between the tip and the sample and the sharpness of the tip apex.Double-stranded (ds) RNA mediates the suppression of specific gene expression, it is the genetic material of a number of viruses, and a key activator of the innate immune response against viral infections. The ever increasing list of roles played by dsRNA in the cell and its potential biotechnological applications over the last decade has raised an interest for the characterization of its mechanical properties and structure, and that includes approaches using Atomic Force Microscopy (AFM) and other single-molecule techniques. Recent reports have resolved the structure of dsDNA with AFM at unprecedented resolution. However, an equivalent study with dsRNA is still lacking. Here, we have visualized the double helix of dsRNA under near-physiological conditions and at sufficient resolution to

  5. MIDAS: Lessons learned from the first spaceborne atomic force microscope

    CERN Document Server

    Bentley, Mark S; Butler, Bart; Gavira, Jose; Jeszenszky, Harald; Mannel, Thurid; Romstedt, Jens; Schmied, Roland; Torkar, Klaus

    2016-01-01

    The Micro-Imaging Dust Analysis System (MIDAS) atomic force microscope (AFM) onboard the Rosetta orbiter was the first such instrument launched into space in 2004. Designed only a few years after the technique was invented, MIDAS is currently orbiting comet 67P Churyumov-Gerasimenko and producing the highest resolution 3D images of cometary dust ever made in situ. After more than a year of continuous operation much experience has been gained with this novel instrument. Coupled with operations of the Flight Spare and advances in terrestrial AFM a set of "lessons learned" has been produced, cumulating in recommendations for future spaceborne atomic force microscopes. The majority of the design could be reused as-is, or with incremental upgrades to include more modern components (e.g. the processor). Key additional recommendations are to incorporate an optical microscope to aid the search for particles and image registration, to include a variety of cantilevers (with different spring constants) and a variety of ...

  6. MIDAS: Lessons learned from the first spaceborne atomic force microscope

    Science.gov (United States)

    Bentley, Mark Stephen; Arends, Herman; Butler, Bart; Gavira, Jose; Jeszenszky, Harald; Mannel, Thurid; Romstedt, Jens; Schmied, Roland; Torkar, Klaus

    2016-08-01

    The Micro-Imaging Dust Analysis System (MIDAS) atomic force microscope (AFM) onboard the Rosetta orbiter was the first such instrument launched into space in 2004. Designed only a few years after the technique was invented, MIDAS is currently orbiting comet 67P Churyumov-Gerasimenko and producing the highest resolution 3D images of cometary dust ever made in situ. After more than a year of continuous operation much experience has been gained with this novel instrument. Coupled with operations of the Flight Spare and advances in terrestrial AFM a set of "lessons learned" has been produced, cumulating in recommendations for future spaceborne atomic force microscopes. The majority of the design could be reused as-is, or with incremental upgrades to include more modern components (e.g. the processor). Key additional recommendations are to incorporate an optical microscope to aid the search for particles and image registration, to include a variety of cantilevers (with different spring constants) and a variety of tip geometries.

  7. Single molecule binding dynamics measured with atomic force microscopy

    International Nuclear Information System (INIS)

    We present a new method to analyse simultaneous Topography and RECognition Atomic Force Microscopy data such that it becomes possible to measure single molecule binding rates of surface bound proteins. We have validated this method on a model system comprising a S-layer surface modified with Strep-tagII for binding sites and strep-tactin bound to an Atomic Force Microscope tip through a flexible Poly-Ethylene-Glycol linker. At larger distances, the binding rate is limited by the linker, which limits the diffusion of the strep-tactin molecule, but at lateral distances below 3 nm, the binding rate is solely determined by the intrinsic molecular characteristics and the surface geometry and chemistry of the system. In this regime, Kon as determined from single molecule TREC data is in agreement with Kon determined using traditional biochemical methods. - Highlights: • We discuss the importance of studying single molecule binding rates for surface bound proteins. • We show measurements of single molecule binding rates on a model system using AFM. • We discuss the influence of various components on the measured binding rates

  8. On averaging force curves over heterogeneous surfaces in atomic force microscopy.

    Science.gov (United States)

    Sokolov, I; Kalaparthi, V; Kreshchuk, M; Dokukin, M E

    2012-10-01

    Atomic force microscopy (AFM) can be used to study mechanics at the nanoscale. Biological surfaces and nanocomposites have typically heterogeneous surfaces, both mechanically and chemically. When studying such surfaces with AFM, one needs to collect a large amount of data to make statistically sound conclusions. It is time- and resource-consuming to process each force curve separately. The analysis of an averaged raw force data is a simple and time saving option, which also averages out the noise and measurement artifacts of the force curves being analyzed. Moreover, some biomedical applications require just an average number per biological cell. Here we investigate such averaging, study the possible artifacts due to the averaging, and demonstrate how to minimize or even to avoid them. We analyze two ways of doing the averaging: over the force data for each particular distance (method 1, the most commonly used way), and over the distances for each particular force (method 2). We derive the errors of the methods in finding to the true average rigidity modulus. We show that both methods are accurate (the error is 100×), method 2 underestimates the average rigidity modulus by a factor of 2, whereas the error of method 1 is only 15%. However, when analyzing the different surface chemistry, which reveals itself in the changing long-range forces, the accuracy of the methods behave oppositely: method 1 can produce a noticeable averaging artifact in the deriving of the long-range forces; whereas method 2 can be successfully used to derive the averaged long-range force parameters without artifacts. We exemplify our conclusions by the study of human cervical cancer and normal epithelial cells, which demonstrate different degrees of heterogeneity. PMID:22917859

  9. Force interactions between magnetite, silica, and bentonite studied with atomic force microscopy

    Science.gov (United States)

    Dobryden, I.; Potapova, E.; Holmgren, A.; Weber, H.; Hedlund, J.; Almqvist, N.

    2015-04-01

    Iron ore pellets consist of variety of mineral particles and are an important refined product used in steel manufacturing. Production of high-quality pellets requires good understanding of interactions between different constituents, such as magnetite, gangue residues, bentonite, and additives. Much research has been reported on magnetite, silica, and bentonite surface properties and their effect on pellet strength but more scant with a focus on a fundamental particle-particle interaction. To probe such particle interaction, atomic force microscopy (AFM) using colloidal probe technique has proven to be a suitable tool. In this work, the measurements were performed between magnetite-magnetite, bentonite-magnetite, silica-bentonite, and silica-magnetite particles in 1 mM CaCl2 solution at various pH values. The interaction character, i.e., repulsion or attraction, was determined by measuring and analyzing AFM force curves. The observed quantitative changes in interaction forces were in good agreement with the measured zeta-potentials for the particles at the same experimental conditions. Particle aggregation was studied by measuring the adhesion force. Absolute values of adhesion forces for different systems could not be compared due to the difference in particle size and contact geometry. Therefore, the relative change of adhesion force between pH 6 and 10 was used for comparison. The adhesion force decreased for the magnetite-magnetite and bentonite-silica systems and slightly increased for the magnetite-bentonite system at pH 10 as compared to pH 6, whereas a pronounced decrease in adhesion force was observed in the magnetite-silica system. Thus, the presence of silica particles on the magnetite surface could have a negative impact on the interaction between magnetite and bentonite in balling due to the reduction of the adhesion force.

  10. Quantification of Staphylococcus aureus adhesion forces on various dental restorative materials using atomic force microscopy

    Science.gov (United States)

    Merghni, Abderrahmen; Kammoun, Dorra; Hentati, Hajer; Janel, Sébastien; Popoff, Michka; Lafont, Frank; Aouni, Mahjoub; Mastouri, Maha

    2016-08-01

    In the oral cavity dental restorative biomaterials can act as a reservoir for infection with opportunistic Staphylococcus aureus pathogen, which can lead to the occurrence of secondary caries and treatment failures. Our aim was to evaluate the adhesion forces by S. aureus on four dental restorative biomaterials and to correlate this finding to differences in specific surface characteristics. Additionally, the influence of salivary conditioning films in exerted adhesion forces was investigated. The substrate hydrophobicity was measured by goniometer and the surface free energy was calculated using the equilibrium advancing contact angle values of water, formamide, and diiodomethane on the tested surfaces. The surface roughness was determined using atomic force microscope (AFM). Additionally, cell force spectroscopy was achieved to quantify the forces that drive cell-substrate interactions. S. aureus bacterium exerted a considerable adhesion forces on various dental restorative materials, which decreased in the presence of saliva conditioning film. The influence of the surface roughness and free energy in initial adhesion appears to be more important than the effect of hydrophobicity, either in presence or absence of saliva coating. Hence, control of surface properties of dental restorative biomaterials is of crucial importance in preventing the attachment and subsequent the biofilm formation.

  11. Scratch direction and threshold force in nanoscale scratching using atomic force microscopes

    Science.gov (United States)

    Tseng, Ampere A.; Kuo, Chung-Feng Jeffrey; Jou, Shyankay; Nishimura, Shinya; Shirakashi, Jun-ichi

    2011-09-01

    The nanoscaled tip in an AFM (atomic force microscope) has become an effective scratching tool for material removing in nanofabrication. In this article, the characteristics of using a diamond-coated pyramidal tip to scratch Ni-Fe thin film surfaces was experimentally investigated with the focus on the evaluation of the influence of the scratch or scan direction on the final shape of the scratched geometry as well as the applied scratch force. Results indicated that both the scratched profile and the scratch force were greatly affected by the scratch direction. It has been found that, to minimize the formation of protuberances along the groove sides and to have a better control of the scratched geometry, the tip face should be perpendicular to the scratching direction, which is also known as orthogonal cutting condition. To demonstrate the present findings, three groove patterns have been scratched with the tip face perpendicular to the scratching direction and very little amount of protuberances was observed. The threshold scratch force was also predicted based on the Hertz contact theory. Without considering the surface friction and adhesive forces between the tip and substrate, the threshold force predicted was twice smaller than the measurement value. Finally, recommendations for technical improvement and research focuses are provided.

  12. Scratch direction and threshold force in nanoscale scratching using atomic force microscopes

    International Nuclear Information System (INIS)

    The nanoscaled tip in an AFM (atomic force microscope) has become an effective scratching tool for material removing in nanofabrication. In this article, the characteristics of using a diamond-coated pyramidal tip to scratch Ni-Fe thin film surfaces was experimentally investigated with the focus on the evaluation of the influence of the scratch or scan direction on the final shape of the scratched geometry as well as the applied scratch force. Results indicated that both the scratched profile and the scratch force were greatly affected by the scratch direction. It has been found that, to minimize the formation of protuberances along the groove sides and to have a better control of the scratched geometry, the tip face should be perpendicular to the scratching direction, which is also known as orthogonal cutting condition. To demonstrate the present findings, three groove patterns have been scratched with the tip face perpendicular to the scratching direction and very little amount of protuberances was observed. The threshold scratch force was also predicted based on the Hertz contact theory. Without considering the surface friction and adhesive forces between the tip and substrate, the threshold force predicted was twice smaller than the measurement value. Finally, recommendations for technical improvement and research focuses are provided.

  13. A comparison of dynamic atomic force microscope set-ups for performing atomic scale manipulation experiments

    International Nuclear Information System (INIS)

    We present the results of calculations performed to investigate the process of single-atom manipulation with the non-contact atomic force microscope comparing the two most common experimental set-ups: a conventional large amplitude silicon cantilever and a small amplitude quartz tuning fork. The manipulation of a model system-an oxygen vacancy in the MgO(001) surface by a single vertical approach at a fixed lateral position-is simulated for each set-up using a detailed and realistic atomistic model that accounts for temperature and the tip trajectory, and it is found that both approaches produce the manipulation event in approximately the same way. The behaviour of the tip dynamics and the resulting response of the instrumentation to the manipulation event is studied using a virtual dynamic atomic force microscope that includes a realistic description of noise for each type of set-up. The results of these calculations indicate how a single-atom manipulation can be performed and recognized by each type of experiment

  14. A new ion sensing deep atomic force microscope

    Science.gov (United States)

    Drake, Barney; Randall, Connor; Bridges, Daniel; Hansma, Paul K.

    2014-08-01

    Here we describe a new deep atomic force microscope (AFM) capable of ion sensing. A novel probe assembly incorporates a micropipette that can be used both for sensing ion currents and as the tip for AFM imaging. The key advance of this instrument over previous ion sensing AFMs is that it uses conventional micropipettes in a novel suspension system. This paper focuses on sensing the ion current passively while using force feedback for the operation of the AFM in contact mode. Two images are obtained simultaneously: (1) an AFM topography image and (2) an ion current image. As an example, two images of a MEMS device with a microchannel show peaks in the ion current as the pipette tip goes over the edges of the channel. This ion sensing AFM can also be used in other modes including tapping mode with force feedback as well as in non-contact mode by utilizing the ion current for feedback, as in scanning ion conductance microscopy. The instrument is gentle enough to be used on some biological samples such as plant leaves.

  15. A new ion sensing deep atomic force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Drake, Barney; Randall, Connor; Bridges, Daniel; Hansma, Paul K. [Department of Physics, University of California, Santa Barbara, California 93106 (United States)

    2014-08-15

    Here we describe a new deep atomic force microscope (AFM) capable of ion sensing. A novel probe assembly incorporates a micropipette that can be used both for sensing ion currents and as the tip for AFM imaging. The key advance of this instrument over previous ion sensing AFMs is that it uses conventional micropipettes in a novel suspension system. This paper focuses on sensing the ion current passively while using force feedback for the operation of the AFM in contact mode. Two images are obtained simultaneously: (1) an AFM topography image and (2) an ion current image. As an example, two images of a MEMS device with a microchannel show peaks in the ion current as the pipette tip goes over the edges of the channel. This ion sensing AFM can also be used in other modes including tapping mode with force feedback as well as in non-contact mode by utilizing the ion current for feedback, as in scanning ion conductance microscopy. The instrument is gentle enough to be used on some biological samples such as plant leaves.

  16. Local Mechanical Properties by Atomic Force Microscopy Nanoindentations

    Science.gov (United States)

    Tranchida, Davide; Piccarolo, Stefano

    The analysis of mechanical properties on a nanometer scale is a useful tool for combining information concerning texture organization obtained by microscopy with the properties of individual components. Moreover, this technique promotes the understanding of the hierarchical arrangement in complex natural materials as well in the case of simpler morphologies arising from industrial processes. Atomic Force Microscopy (AFM) can bridge morphological information, obtained with outstanding resolution, to local mechanical properties. When performing an AFM nanoindentation, the rough force curve, i.e., the plot of the voltage output from the photodiode vs. the voltage applied to the piezo-scanner, can be translated into a curve of the applied load vs. the penetration depth after a series of preliminary determinations and calibrations. However, the analysis of the unloading portion of the force curves collected for polymers does not lead to a correct evaluation of Young's modulus. The high slope of the unloading curves is not linked to an elastic behavior, as would be expected, but rather to a viscoelastic effect. This can be argued on the basis that the unloading curves are superimposed on the loading curves in the case of an ideal elastic behavior, as for rubbers, or generally in the case of materials with very short relaxation times. In contrast, when the relaxation time of the sample is close to or even much larger than the indentation time scale, very high slopes are recorded.

  17. Multifunctional hydrogel nano-probes for atomic force microscopy

    Science.gov (United States)

    Lee, Jae Seol; Song, Jungki; Kim, Seong Oh; Kim, Seokbeom; Lee, Wooju; Jackman, Joshua A.; Kim, Dongchoul; Cho, Nam-Joon; Lee, Jungchul

    2016-01-01

    Since the invention of the atomic force microscope (AFM) three decades ago, there have been numerous advances in its measurement capabilities. Curiously, throughout these developments, the fundamental nature of the force-sensing probe—the key actuating element—has remained largely unchanged. It is produced by long-established microfabrication etching strategies and typically composed of silicon-based materials. Here, we report a new class of photopolymerizable hydrogel nano-probes that are produced by bottom-up fabrication with compressible replica moulding. The hydrogel probes demonstrate excellent capabilities for AFM imaging and force measurement applications while enabling programmable, multifunctional capabilities based on compositionally adjustable mechanical properties and facile encapsulation of various nanomaterials. Taken together, the simple, fast and affordable manufacturing route and multifunctional capabilities of hydrogel AFM nano-probes highlight the potential of soft matter mechanical transducers in nanotechnology applications. The fabrication scheme can also be readily utilized to prepare hydrogel cantilevers, including in parallel arrays, for nanomechanical sensor devices. PMID:27199165

  18. Multifunctional hydrogel nano-probes for atomic force microscopy

    Science.gov (United States)

    Lee, Jae Seol; Song, Jungki; Kim, Seong Oh; Kim, Seokbeom; Lee, Wooju; Jackman, Joshua A.; Kim, Dongchoul; Cho, Nam-Joon; Lee, Jungchul

    2016-05-01

    Since the invention of the atomic force microscope (AFM) three decades ago, there have been numerous advances in its measurement capabilities. Curiously, throughout these developments, the fundamental nature of the force-sensing probe--the key actuating element--has remained largely unchanged. It is produced by long-established microfabrication etching strategies and typically composed of silicon-based materials. Here, we report a new class of photopolymerizable hydrogel nano-probes that are produced by bottom-up fabrication with compressible replica moulding. The hydrogel probes demonstrate excellent capabilities for AFM imaging and force measurement applications while enabling programmable, multifunctional capabilities based on compositionally adjustable mechanical properties and facile encapsulation of various nanomaterials. Taken together, the simple, fast and affordable manufacturing route and multifunctional capabilities of hydrogel AFM nano-probes highlight the potential of soft matter mechanical transducers in nanotechnology applications. The fabrication scheme can also be readily utilized to prepare hydrogel cantilevers, including in parallel arrays, for nanomechanical sensor devices.

  19. Quantification of the lateral detachment force for bacterial cells using atomic force microscope and centrifugation

    International Nuclear Information System (INIS)

    To determine the lateral detachment force for individual bacterial cells, a quantitative method using the contact mode of an atomic force microscope (AFM) was developed in this study. Three key factors for the proposed method, i.e. scan size, scan rate and cantilever choice, were evaluated and optimized. The scan size of 40x40 μm2 was optimal for capturing sufficient number of adhered cells in a microscopic field and provide adequate information for cell identification and detachment force measurement. The scan rate affected the measurement results significantly, and was optimized at 40 μm/s considering both force measurement accuracy and experimental efficiency. The hardness of applied cantilevers also influenced force determination. The proposed protocol for cantilever selection is to use those with the lowest spring constant first and then step up to a harder cantilever until all cells are detached. The lateral detachment force of Escherichia coli cells on polished stainless steel and a glass-slide coated with poly-L-lysine were measured as 0.763±0.167 and 0.639±0.136 nN, respectively. The results showed that the established method had good repeatability and sensitivity to various bacteria/substrata combinations. The detachment force quantified by AFM (0.639±0.136 nN) was comparable to that measured by the centrifugation method (1.12 nN). -- Research highlights: → A quantitative method via AFM is developed to measure the lateral detachment force of an attached cell. → The parameters of AFM operation for this method are optimized. → The tests using E. coli on different substrata show that the method has good repeatability and sensitivity. → The method could obtain reliable results that are comparable to those using the centrifugation approach.

  20. A measurement of the hysteresis loop in force-spectroscopy curves using a tuning-fork atomic force microscope

    OpenAIRE

    Manfred Lange; Dennis van Vörden; Rolf Möller

    2012-01-01

    Measurements of the frequency shift versus distance in noncontact atomic force microscopy (NC-AFM) allow measurements of the force gradient between the oscillating tip and a surface (force-spectroscopy measurements). When nonconservative forces act between the tip apex and the surface the oscillation amplitude is damped. The dissipation is caused by bistabilities in the potential energy surface of the tip–sample system, and the process can be understood as a hysteresis of forces between...

  1. Variable-force tapping atomic force microscopy as a tool in the characterization of organic devices

    International Nuclear Information System (INIS)

    A common method for characterizing the phase separation of materials in mixtures is tapping mode atomic force microscopy (AFM). However, AFM results are influenced by surface-energy effects and the employed tapping force, and it might therefore be difficult to attain correct information regarding the bulk with such a surface-imaging technique. In this work, we present a way of imaging material phase separation in an improved manner by recording a series of AFM images at different tapping force. More specifically, we have employed the variable-force AFM method on organic mixtures, comprising a conjugated polymer (MEH-PPV) and an ion-conducting polymer electrolyte (PEO-XCF3SO3, X=Li, K, Rb), and we demonstrate that it is capable of reversibly sampling such materials not only on the surface, but also (indirectly) in the topmost part of the bulk. The analysis of the evolution of AFM phase images allows us to (indirectly) gain information about the bulk-phase separation of materials. We find that the variable-force AFM results correlate well with the device performance of light-emitting electrochemical cells employing such organic mixtures as the active material

  2. Interaction forces between silica surfaces in cationic surfactant solutions: an atomic force microscopy study.

    Science.gov (United States)

    Lüderitz, Liset A C; v Klitzing, Regine

    2013-07-15

    The interaction forces between silicon oxide surfaces in the presence of surfactant solutions were studied. Based on the qualitative and quantitative analysis of these interaction forces the correlation with the structure of the aggregates on the surfaces is analyzed. A colloidal probe atomic force microscope (AFM) was used to measure the forces between two colloidal silica particles and between a colloidal particle and a silicon wafer in the presence of hexadecyltrimethylammonium bromide (CTAB) at concentrations between 0.005 mM and 1.2 mM. Different interaction forces were obtained for the silica particle-silica particle system when compared to those for the silica particle-silicon wafer system for the same studied concentration. This indicates that the silica particles and the silicon wafer have different aggregate morphologies on their surfaces. The point of zero charge (pzc) was obtained at 0.05 mM CTAB concentration for the silica particles and at 0.3mM for the silica particle-silicon wafer system. This indicates a higher charge at the silicon wafer than at the silica particles. The observed long range attractions are explained by nanobubbles present at the silicon oxide surfaces and/or by attractive electrostatic interactions between the surfaces, induced by oppositely charged patches at the opposing Si oxide surfaces. PMID:23647691

  3. Surface properties and interaction forces of biopolymer-doped conductive polypyrrole surfaces by atomic force microscopy.

    Science.gov (United States)

    Pelto, Jani M; Haimi, Suvi P; Siljander, Aliisa S; Miettinen, Susanna S; Tappura, Kirsi M; Higgins, Michael J; Wallace, Gordon G

    2013-05-21

    Surface properties and electrical charges are critical factors elucidating cell interactions on biomaterial surfaces. The surface potential distribution and the nanoscopic and microscopic surface elasticity of organic polypyrrole-hyaluronic acid (PPy-HA) were studied by atomic force microscopy (AFM) in a fluid environment in order to explain the observed enhancement in the attachment of human adipose stem cells on positively charged PPy-HA films. The electrostatic force between the AFM tip and a charged PPy-HA surface, the tip-sample adhesion force, and elastic moduli were estimated from the AFM force curves, and the data were fitted to electrostatic double-layer and elastic contact models. The surface potential of the charged and dried PPy-HA films was assessed with Kelvin probe force microscopy (KPFM), and the KPFM data were correlated to the fluid AFM data. The surface charge distribution and elasticity were both found to correlate well with the nodular morphology of PPy-HA and to be sensitive to the electrochemical charging conditions. Furthermore, a significant change in the adhesion was detected when the surface was electrochemically charged positive. The results highlight the potential of positively charged PPy-HA as a coating material to enhance the stem cell response in tissue-engineering scaffolds. PMID:23621360

  4. Gating mechanosensitive channels in bacteria with an atomic force microscope

    Science.gov (United States)

    Garces, Renata; Miller, Samantha; Schmidt, Christoph F.; Third Institute of Physics Team; School of Medical Sciences Collaboration

    The regulation of growth and integrity of bacteria is critically linked to mechanical stress. Bacteria typically maintain a high difference of osmotic pressure (turgor pressure) with respect to the environment. This pressure difference (on the order of 1 atm) is supported by the cell envelope, a composite of lipid membranes and a rigid cell wall. Turgor pressure is controlled by the ratio of osmolytes inside and outside bacteria and thus, can abruptly increase upon osmotic downshock. For structural integrity bacteria rely on the mechanical stability of the cell wall and on the action of mechanosensitive (MS) channels: membrane proteins that release solutes in response to stress in the cell envelope. We here present experimental data on MS channels gating. We activate channels by indenting living bacteria with the cantilever of an atomic force microscope (AFM). We compare responses of wild-type and mutant bacteria in which some or all MS channels have been eliminated.

  5. Mechanical manifestations of rare atomic jumps in dynamic force microscopy

    Science.gov (United States)

    Hoffmann, R.; Baratoff, A.; Hug, H. J.; Hidber, H. R.; Löhneysen, H. v.; Güntherodt, H.-J.

    2007-10-01

    The resonance frequency and the excitation amplitude of a silicon cantilever have been measured as a function of distance to a cleaved KBr(001) surface with a low-temperature scanning force microscope (SFM) in ultrahigh vacuum. We identify two regimes of tip-sample distances. Above a site-dependent critical tip-sample distance reproducible data with low noise and no interaction-induced energy dissipation are measured. In this regime reproducible SFM images can be recorded. At closer tip-sample distances, above two distinct atomic sites, the frequency values jump between two limiting curves on a timescale of tens of milliseconds. Furthermore, additional energy dissipation occurs wherever jumps are observed. We attribute both phenomena to rarely occurring changes in the tip apex configuration which are affected by short-range interactions with the sample. Their respective magnitudes are related to each other. A specific candidate two-level system is also proposed.

  6. Inverstigation of chromatin folding patterns by atomic force microscopy

    Institute of Scientific and Technical Information of China (English)

    ZHANGYi; OUYANGZhenqian; 等

    1999-01-01

    The chromatin folding patterns in air and liquid were studied by atomic force microscopy(AFM),A gentle water-air interface method was adopted to spread chromatin from interphase nucleus of chicken erythrocyte.The chromatin was absorbed on APS-mica surface and studied with AFM,Beads-on a-string were observed and many higher-order structrues such as superbeads with dimensions 40-60nm in diameter and 4-7nm in height were found to string together to make chromation fibers.When sample spreading and absorbing time were shortened.higher-order chromatin fibers with 60-120nm in width were observed in air as well as under water environment.These chromatin structures may reflect chromatin folding patterns in the living cells.

  7. Visualization of Cytoskeletal Elements by the Atomic Force Microscope

    CERN Document Server

    Berdyyeva, T; Sokolov, I

    2004-01-01

    We describe a novel application of atomic force microscopy (AFM) to directly visualize cytoskeletal fibers in human foreskin epithelial cells. The nonionic detergent Triton X-100 in a low concentration was used to remove the membrane, soluble proteins, and organelles from the cell. The remaining cytoskeleton can then be directly visualized in either liquid or air-dried ambient conditions. These two types of scanning provide complimentary information. Scanning in liquid visualizes the surface filaments of the cytoskeleton, whereas scanning in air shows both the surface filaments and the total "volume" of the cytoskeletal fibers. The smallest fibers observed were ca. 50 nm in diameter. The lateral resolution of this technique was ca.20 nm, which can be increased to a single nanometer level by choosing sharper AFM tips. Because the AFM is a true three dimensional technique, we are able to quantify the observed cytoskeleton by its density and volume. The types of fibers can be identified by their size, similar to...

  8. New approaches to atomic force microscope lithography on silicon

    DEFF Research Database (Denmark)

    Birkelund, Karen; Thomsen, Erik Vilain; Rasmussen, Jan Pihl;

    1997-01-01

    is used to add the finer nanostructures. Both methods are based on selective oxidation of hydrogen-passivated silicon and subsequent etching to define conducting regions on the surface. This combined technique has previously been implemented on amorphous Si on oxide. To extend the technique to form......We have investigated new approaches to the formation of conducting nanowires on crystalline silicon surfaces using atomic force microscope (AFM) lithography. To increase processing speed and reduce wear of the AFM tip, large-scale structures are formed with a direct laser write setup, while the AFM...... crystalline silicon nanowires, we have used an arsenic implanted crystalline silicon layer on p-type Si, where the nanostructures are isolated from the substrate electrically due to p-n junction formation. Improvements in the reliability of the AFM lithography technique were achieved by using all-metal tips...

  9. Unlocking higher harmonics in atomic force microscopy with gentle interactions

    Directory of Open Access Journals (Sweden)

    Sergio Santos

    2014-03-01

    Full Text Available In dynamic atomic force microscopy, nanoscale properties are encoded in the higher harmonics. Nevertheless, when gentle interactions and minimal invasiveness are required, these harmonics are typically undetectable. Here, we propose to externally drive an arbitrary number of exact higher harmonics above the noise level. In this way, multiple contrast channels that are sensitive to compositional variations are made accessible. Numerical integration of the equation of motion shows that the external introduction of exact harmonic frequencies does not compromise the fundamental frequency. Thermal fluctuations are also considered within the detection bandwidth of interest and discussed in terms of higher-harmonic phase contrast in the presence and absence of an external excitation of higher harmonics. Higher harmonic phase shifts further provide the means to directly decouple the true topography from that induced by compositional heterogeneity.

  10. Silicon Carbide Epitaxial Films Studied by Atomic Force Microscopy

    Science.gov (United States)

    1996-01-01

    Silicon carbide (SiC) holds great potential as an electronic material because of its wide band gap energy, high breakdown electric field, thermal stability, and resistance to radiation damage. Possible aerospace applications of high-temperature, high-power, or high-radiation SiC electronic devices include sensors, control electronics, and power electronics that can operate at temperatures up to 600 C and beyond. Commercially available SiC devices now include blue light-emitting diodes (LED's) and high-voltage diodes for operation up to 350 C, with other devices under development. At present, morphological defects in epitaxially grown SiC films limit their use in device applications. Research geared toward reducing the number of structural inhomogeneities can benefit from an understanding of the type and nature of problems that cause defects. The Atomic Force Microscope (AFM) has proven to be a useful tool in characterizing defects present on the surface of SiC epitaxial films. The in-house High-Temperature Integrated Electronics and Sensors (HTIES) Program at the NASA Lewis Research Center not only extended the dopant concentration range achievable in epitaxial SiC films, but it reduced the concentration of some types of defects. Advanced structural characterization using the AFM was warranted to identify the type and structure of the remaining film defects and morphological inhomogeneities. The AFM can give quantitative information on surface topography down to molecular scales. Acquired, in part, in support of the Advanced High Temperature Engine Materials Technology Program (HITEMP), the AFM had been used previously to detect partial fiber debonding in composite material cross sections. Atomic force microscopy examination of epitaxial SiC film surfaces revealed molecular-scale details of some unwanted surface features. Growth pits propagating from defects in the substrate, and hillocks due, presumably, to existing screw dislocations in the substrates, were

  11. Mathematical modeling of nanomachining with atomic force microscope cantilevers

    International Nuclear Information System (INIS)

    This article theoretically analyzes the cutting depth and material removal rate of an atomic force microscope (AFM) cantilever during nanomachining. An analytical expression for the vibration frequency and displacement of the cantilever has been obtained by using the modified couple stress theory. The theory includes one additional material length scale parameter revealing the micro-scale effect. According to the analysis, the results show that the effect of size-dependent on the vibration behavior of the AFM cantilever is obvious. The maximum displacement of nanomachining with the AFM cantilever represents the cutting depth. The area under the displacement-time curve is related to the material removal rate. When the excitation frequency is closer to the nature frequency of the cantilever, a larger material removal rate is obtained

  12. Nanodot deposition and its application with atomic force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Liu Zenglei, E-mail: liuzenglei@sia.cn; Jiao Niandong, E-mail: ndjiao@sia.cn [Chinese Academy of Sciences, State Key Laboratory of Robotics, Shenyang Institute of Automation (China); Xu Ke [Shenyang Jianzhu University (China); Wang, Zhidong [Chiba Institute of Technology (Japan); Dong Zaili; Liu Lianqing [Chinese Academy of Sciences, State Key Laboratory of Robotics, Shenyang Institute of Automation (China)

    2013-06-15

    Nanodot deposition using atomic force microscope (AFM) is investigated. To realize repeatable and precise deposition of nanodots, the detailed control method is discussed. The electric field between AFM tip and substrate is analyzed, and a convenient method to control tip-substrate separation is proposed. In experiments, two nanodot matrixes are fabricated and the heights of the nanodots are analyzed. Experimental results testify that the control method can lead to repeatable and precise fabrication of deposited nanodots. As an application of deposited nanodots, a carbon nanotube (CNT) is soldered on gold electrodes with deposited Au nanodots. After soldering, the contact resistances between the CNT and the electrodes decrease greatly. AFM-based nanodot deposition can be used to fabricate special nanopatterns; also it can be used to solder nanomaterials on substrates to improve the electrical connection, which has a promising future for nanodevice fabrication.

  13. Atomic force microscopy analysis of rat pulmonary surfactant films.

    Science.gov (United States)

    Jiao, Xiujun; Keating, Eleonora; Tadayyon, Seyed; Possmayer, Fred; Zuo, Yi Y; Veldhuizen, Ruud A W

    2011-10-01

    Pulmonary surfactant facilitates breathing by forming a surface tension reducing film at the air-liquid interface of the alveoli. The objective was to characterize the structure of surfactant films using endogenous rat surfactant. Solid-support surfactant films, at different surface pressures, were obtained using a Langmuir balance and were analyzed using atomic force microscopy. The results showed a lipid film structure with three distinct phases: liquid expanded, liquid ordered and liquid condensed. The area covered by the liquid condensed domains increased as surface pressure increased. The presence of liquid ordered phase within these structures correlated with the cholesterol content. At a surface pressure of 50 mN/m, stacks of bilayers appeared. Several structural details of these films differ from previous observations made with goat and exogenous surfactants. Overall, the data indicate that surfactant films demonstrate phase separation at low surface pressures and multilayer formation at higher pressure, features likely important for normal surfactant function. PMID:21704443

  14. The long range voice coil atomic force microscope

    International Nuclear Information System (INIS)

    Most current atomic force microscopes (AFMs) use piezoelectric ceramics for scan actuation. Piezoelectric ceramics provide precision motion with fast response to applied voltage potential. A drawback to piezoelectric ceramics is their inherently limited ranges. For many samples this is a nonissue, as imaging the nanoscale details is the goal. However, a key advantage of AFM over other microscopy techniques is its ability to image biological samples in aqueous buffer. Many biological specimens have topography for which the range of piezoactuated stages is limiting, a notable example of which is bone. In this article, we present the use of voice coils in scan actuation for an actuation range in the Z-axis an order of magnitude larger than any AFM commercially available today. The increased scan size will allow for imaging an important new variety of samples, including bone fractures.

  15. A Conceptual Atomic Force Microscope using LEGO for Nanoscience Education

    Directory of Open Access Journals (Sweden)

    Tsung-Han Hsieh

    2014-05-01

    Full Text Available A lack of effective educational materials is limited general public awareness of, and interest in, nanoscience. This paper presents a conceptual atomic force microscope (AFM model built by using the LEGO® MINDSTORMS series. AFMs are perhaps one of the most fundamental and widely-used instruments in nanoscience and nanotechnology, thus the introduction of this LEGO® AFM should be beneficial to nanoscience education. Programmed in LabVIEW, this LEGO® model has the ability to scan the samples and construct a three-dimensional (3D surface graphs of the sample, based on the mechanism used for AFM. With this LEGO® AFM, the students can directly access nanoscience concepts through hands-on experience constructing an AFM model. This interaction will lead to a better understanding of nanoscience principles, and motivate learners to further explore both the theoretical and experimental aspects of the domain.

  16. Nanoscale imaging of Bacillus thuringiensis flagella using atomic force microscopy

    Science.gov (United States)

    Gillis, Annika; Dupres, Vincent; Delestrait, Guillaume; Mahillon, Jacques; Dufrêne, Yves F.

    2012-02-01

    Because bacterial flagella play essential roles in various processes (motility, adhesion, host interactions, secretion), studying their expression in relation to function is an important challenge. Here, we use atomic force microscopy (AFM) to gain insight into the nanoscale surface properties of two wild-type and four mutant strains of Bacillus thuringiensis exhibiting various levels of flagellation. We show that, unlike AFM in liquid, AFM in air is a simple and reliable approach to observe the morphological details of the bacteria, and to quantify the density and dimensions of their flagella. We found that the amount of flagella expressed by the six strains, as observed at the nanoscale, correlates with their microscopic swarming motility. These observations provide novel information on flagella expression in Gram-positive bacteria and demonstrate the power of AFM in genetic studies for the fast assessment of the phenotypic characteristics of bacterial strains altered in cell surface appendages.Because bacterial flagella play essential roles in various processes (motility, adhesion, host interactions, secretion), studying their expression in relation to function is an important challenge. Here, we use atomic force microscopy (AFM) to gain insight into the nanoscale surface properties of two wild-type and four mutant strains of Bacillus thuringiensis exhibiting various levels of flagellation. We show that, unlike AFM in liquid, AFM in air is a simple and reliable approach to observe the morphological details of the bacteria, and to quantify the density and dimensions of their flagella. We found that the amount of flagella expressed by the six strains, as observed at the nanoscale, correlates with their microscopic swarming motility. These observations provide novel information on flagella expression in Gram-positive bacteria and demonstrate the power of AFM in genetic studies for the fast assessment of the phenotypic characteristics of bacterial strains altered in

  17. The atomic force microscope as a mechano–electrochemical pen

    Directory of Open Access Journals (Sweden)

    Christian Obermair

    2011-10-01

    Full Text Available We demonstrate a method that allows the controlled writing of metallic patterns on the nanometer scale using the tip of an atomic force microscope (AFM as a “mechano–electrochemical pen”. In contrast to previous experiments, no voltage is applied between the AFM tip and the sample surface. Instead, a passivated sample surface is activated locally due to lateral forces between the AFM tip and the sample surface. In this way, the area of tip–sample interaction is narrowly limited by the mechanical contact between tip and sample, and well-defined metallic patterns can be written reproducibly. Nanoscale structures and lines of copper were deposited, and the line widths ranged between 5 nm and 80 nm, depending on the deposition parameters. A procedure for the sequential writing of metallic nanostructures is introduced, based on the understanding of the passivation process. The mechanism of this mechano–electrochemical writing technique is investigated, and the processes of site-selective surface depassivation, deposition, dissolution and repassivation of electrochemically deposited nanoscale metallic islands are studied in detail.

  18. Small cantilevers for atomic force microscopy and force spectroscopy of biological molecules

    Science.gov (United States)

    Viani, M. B.; Schaffer, T. E.; Chand, A.; Smith, B. L.; Hansma, P. K.; Wendman, M.

    1998-03-01

    Small cantilevers offer new possibilities for high speed/low noise atomic force microscopy of soft, biological samples. We have used a novel process to fabricate metallic cantilevers that should maximize reflectivity and minimize thermal bending. We have fabricated and measured the properties of aluminum, nickel, silver, and 14-karat gold cantilevers that are 3-12 um long, 1-4 um wide, and 60-300 nm thick and have resonant frequencies of 0.5-2 MHz and spring constants of 0.1-3 N/m. We also have fabricated small cantilevers with ultra-low spring constants (1-10 mN/m) out of silicon nitride and used them for force spectroscopy of DNA. This work was supported by grant numbers NSF-DMR9622169 and NSF-DMR9632716 from the Materials Research Division of the National Science Foundation and by grant number DAAH04-96-1-004 from the Army Research Office.

  19. Nanomechanical cutting of boron nitride nanotubes by atomic force microscopy

    Science.gov (United States)

    Zheng, Meng; Chen, Xiaoming; Park, Cheol; Fay, Catharine C.; Pugno, Nicola M.; Ke, Changhong

    2013-12-01

    The length of nanotubes is a critical structural parameter for the design and manufacture of nanotube-based material systems and devices. High-precision length control of nanotubes by means of mechanical cutting using a scriber has not materialized due to the lack of the knowledge of the appropriate cutting conditions and the tube failure mechanism. In this paper, we present a quantitative nanomechanical study of the cutting of individual boron nitride nanotubes (BNNTs) using atomic force microscopy (AFM) probes. In our nanotube cutting measurements, a nanotube standing still on a flat substrate was laterally scribed by an AFM tip. The tip-tube collision force deformed the tube, and eventually fractured the tube at the collision site by increasing the cutting load. The mechanical response of nanotubes during the tip-tube collision process and the roles of the scribing velocity and the frictional interaction on the tip-tube collision contact in cutting nanotubes were quantitatively investigated by cutting double-walled BNNTs of 2.26-4.28 nm in outer diameter. The fracture strength of BNNTs was also quantified based on the measured collision forces and their structural configurations using contact mechanics theories. Our analysis reports fracture strengths of 9.1-15.5 GPa for the tested BNNTs. The nanomechanical study presented in this paper demonstrates that the AFM-based nanomechanical cutting technique not only enables effective control of the length of nanotubes with high precision, but is also promising as a new nanomechanical testing technique for characterizing the mechanical properties of tubular nanostructures.

  20. Quantitative comparison of two independent lateral force calibration techniques for the atomic force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Barkley, Sarice S.; Cannara, Rachel J. [Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States); Deng Zhao [Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States); Maryland NanoCenter, University of Maryland, College Park, Maryland 20742 (United States); Gates, Richard S.; Reitsma, Mark G. [Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States)

    2012-02-15

    Two independent lateral-force calibration methods for the atomic force microscope (AFM)--the hammerhead (HH) technique and the diamagnetic lateral force calibrator (D-LFC)--are systematically compared and found to agree to within 5% or less, but with precision limited to about 15%, using four different tee-shaped HH reference probes. The limitations of each method, both of which offer independent yet feasible paths toward traceable accuracy, are discussed and investigated. We find that stiff cantilevers may produce inconsistent D-LFC values through the application of excessively high normal loads. In addition, D-LFC results vary when the method is implemented using different modes of AFM feedback control, constant height and constant force modes, where the latter is more consistent with the HH method and closer to typical experimental conditions. Specifically, for the D-LFC apparatus used here, calibration in constant height mode introduced errors up to 14 %. In constant force mode using a relatively stiff cantilever, we observed an {approx_equal} 4 % systematic error per {mu}N of applied load for loads {<=} 1 {mu}N. The issue of excessive load typically emerges for cantilevers whose flexural spring constant is large compared with the normal spring constant of the D-LFC setup (such that relatively small cantilever flexural displacements produce relatively large loads). Overall, the HH method carries a larger uncertainty, which is dominated by uncertainty in measurement of the flexural spring constant of the HH cantilever as well as in the effective length dimension of the cantilever probe. The D-LFC method relies on fewer parameters and thus has fewer uncertainties associated with it. We thus show that it is the preferred method of the two, as long as care is taken to perform the calibration in constant force mode with low applied loads.

  1. Conductive transparent fiber probes for shear-force atomic force microscopes

    International Nuclear Information System (INIS)

    New conductive transparent (CT) probes that can inject currents into nanometer-sized regions and collect light from them have been developed for shear-force atomic force microscopy (SF-AFM) of partially isolative regions. The CT probe consists of a straight elastic silica fiber with one end tapered to a point. The taper is coated with an indium-tin-oxide film as a transparent electrode, and the probe apex has a nanometer-scale radius. The essential feature of the CT probes is coaxial nickel plating on the shaft of the isolative silica fiber, which is adjusted to obtain suitable elasticity for smooth shear-force feedback as well as for supplying currents to the transparent electrode. Experimental results clarified that nickel thickness between 0.5 and 15 μm on 20 mm-long fibers makes resistance low enough for supplying current to the probe apex and also makes the Q curves smooth enough for shear-force feedback. Clear SF-AFM and current images were successfully obtained for a sample containing both conductive and isolative regions. The CT probes for SF-AFM can expand applications of probe-current-induced luminescence measurements to samples that contain highly resistive and isolative regions, for which scanning tunneling microscopy cannot be applied

  2. Novel parallel plate condenser for single particle electrostatic force measurements in atomic force microscope

    KAUST Repository

    Kwek, Jin Wang

    2011-07-01

    A combination of small parallel plate condenser with Indium Tin Oxide (ITO) glass slides as electrodes and an atomic force microscope (AFM) is used to characterize the electrostatic behavior of single glass bead microparticles (105-150 μm) glued to the AFM cantilever. This novel setup allows measurements of the electrostatic forces acting on a particle in an applied electrical field to be performed in ambient air conditions. By varying the position of the microparticle between the electrodes and the strength of the applied electric field, the relative contributions of the particle net charge, induced and image charges were investigated. When the microparticle is positioned in the middle of the electrodes, the force acting on the microparticle was linear with the applied electric field and proportional to the microparticle net charge. At distances close to the bottom electrode, the force follows a parabolic relationship with the applied electric field reflecting the contributions of induced and image charges. The method can be used for the rapid evaluation of the charging and polarizability properties of the microparticle as well as an alternative to the conventional Faraday\\'s pail technique. © 2011 Elsevier B.V.

  3. Characterization of English ivy (Hedera helix) adhesion force and imaging using atomic force microscopy

    International Nuclear Information System (INIS)

    English ivy (Hedera helix) is well known for its ability to climb onto and strongly adhere to a variety of solid substrates. It has been discovered that the ivy aerial rootlet secretes an adhesive composed of polysaccharide and spherical nanoparticles. This study aims to characterize the mechanical properties of the nanocomposite adhesive using atomic force microscopy (AFM). The adhesive was first imaged by AFM to visualize the nanocomposite. Mechanical properties were then determined at various time points, from secretion to hardening. The experimental results indicate that the ivy adhesive exhibited strong adhesion strength and high elasticity. There was a decrease in adhesive force over time, from 298 to 202 nN during the 24-h study. Accompanying with it were the limited changes in extension length and Young’s modulus. The limited curing process of the ivy adhesive helps fill gaps in the attaching surface, leading to more intimate contact and increased van der Waals interactions with the surface. However, study based on a mechanical model indicated that van der Waals force alone is not significant enough to account for all of the measured force. Other chemical interactions and cross linking likely contribute to the strong adhesion strength of ivy.

  4. Fluctuations of the Casimir-Polder force between an atom and a conducting wall

    International Nuclear Information System (INIS)

    We consider quantum fluctuations of the Casimir-Polder force between a neutral atom and a perfectly conducting wall in the ground state of the system. In order to obtain the atom-wall force fluctuation we first define an operator directly associated with the force experienced by the atom considered as a polarizable body in an electromagnetic field and we use a time-averaged force operator in order to avoid ultraviolet divergences appearing in the fluctuation of the force. This time-averaged force operator takes into account that any measurement involves a finite time. We also calculate the Casimir-Polder force fluctuation for an atom between two conducting walls. Experimental observability of these Casimir-Polder force fluctuations is also discussed, as well as the dependence of the relative force fluctuation on the duration of the measurement

  5. Understanding the Atomic-Scale Contrast in Kelvin Probe Force Microscopy

    OpenAIRE

    Nony, Laurent; Foster, Adam S.; Bocquet, Franck; Loppacher, Christian

    2009-01-01

    A numerical analysis of the origin of the atomic-scale contrast in Kelvin probe force microscopy is presented. Atomistic simulations of the tip-sample interaction force field have been combined with a noncontact atomic force microscope simulator including a Kelvin module. The implementation mimics recent experimental results on the (001) surface of a bulk alkali halide crystal for which simultaneous atomic-scale topographical and contact potential difference contrasts were reported. The local...

  6. Understanding the atomic-scale contrast in Kelvin Probe Force Microscopy

    OpenAIRE

    Nony, Laurent; Foster, Adam; Bocquet, Franck; Loppacher, Christian

    2009-01-01

    A numerical analysis of the origin of the atomic-scale contrast in Kelvin probe force microscopy (KPFM) is presented. Atomistic simulations of the tip-sample interaction force field have been combined with a non-contact Atomic Force Microscope/KPFM simulator. The implementation mimics recent experimental results on the (001) surface of a bulk alkali halide crystal for which simultaneous atomic-scale topographical and Contact Potential Difference (CPD) contrasts were reported. The local CPD do...

  7. Manipulation and Graphene local oxidation lithography using an Atomic Force Microscope

    International Nuclear Information System (INIS)

    in this work, SPM nano lithography in Atomic Force Microscope mode was used to etching and manipulate graphene films on a nanoscopic length scale in order to produce electronic nano structures. By means of local anodic oxidation with an Atomic Force Microscope which is an electrochemical process applying voltage between Atomic Force Microscope probe and graphene surface, we are able to structure isolating trenches into single-layer and few-layer graphene flakes. Trench sizes of less than 30 nm in width are attainable with this technique. Besides oxidation, the influence of mechanical peeling and scratching with an Atomic Force Microscope of few layer graphene sheets was investigated.

  8. Visualization of polymer macromolecules with atomic force microscopy

    International Nuclear Information System (INIS)

    Full text: Visualization of individual macromolecules with atomic force microscopy (AFM) becomes the important issue because of the high expectations of nanoscience and nanotechnology. At present, the practical applications of nanotechnology are quite limited, yet many of them benefit from AFM. Complementing microscopic and diffraction techniques, AFM is established itself as a routine tool for recognition, control and manipulation of surface objects in the sub-micron scale. Important issues of the AFM imaging at this scale are a calibration of the piezoelectric actuators and a preparation of samples. For the precise imaging of objects in the nanometer-scale, a couple of calibration samples with a pitch of 1.23 nm and 7.5 nm will be introduced. Various sample preparation techniques (spin-casting, dipping, Langmuir-Blodgett, vapor deposition, etc) and different substrates are usually applied in AFM of single macromolecules. In addition to the proper calibration and sample preparation, an optimization of imaging conditions helps reveal the nanometer-scale structures in a reliable fashion. Practical results, which were obtained in visualization of polymer macromolecules of spherical and cylindrical shape, will be discussed. A special attention will be paid to the interplay of the adsorbate-substrate epitaxy, intermolecular interactions between the adsorbed macromolecules and tip-sample forces. These factors are governing not only a conformation of isolated single macromolecules on surfaces and their self-assembly in the adsorbed layers and but also the AFM capabilities of visualization and manipulation of these objects. Copyright (2002) Australian Society for Electron Microscopy Inc

  9. Modelling atomic scale manipulation with the non-contact atomic force microscope

    International Nuclear Information System (INIS)

    We present the results of calculations performed to model the process of lateral manipulation of an oxygen vacancy in the MgO(001) surface using the non-contact atomic force microscope (NC-AFM). The potential energy surfaces for the manipulation as a function of tip position are determined from atomistic modelling of the MgO(001) surface interacting with a Mg terminated MgO tip. These energies are then used to model the dynamical evolution of the system as the tip oscillates and at a finite temperature using a kinetic Monte Carlo method. The manipulation process is strongly dependent on the lateral position of the tip and the system temperature. It is also found that the expectation value of the point at which the vacancy jumps depends on the trajectory of the oscillating cantilever as the surface is approached. The effect of the manipulation on the operation of the NC-AFM is modelled with a virtual dynamic AFM, which explicitly simulates the entire experimental instrumentation and control loops. We show how measurable experimental signals can result from a single controlled atomic scale event and suggest the most favourable conditions for achieving successful atomic scale manipulation experimentally

  10. High viscosity environments: an unexpected route to obtain true atomic resolution with atomic force microscopy

    International Nuclear Information System (INIS)

    Atomic force microscopy (AFM) is widely used in liquid environments, where true atomic resolution at the solid–liquid interface can now be routinely achieved. It is generally expected that AFM operation in more viscous environments results in an increased noise contribution from the thermal motion of the cantilever, thereby reducing the signal-to-noise ratio (SNR). Thus, viscous fluids such as ionic and organic liquids have been generally avoided for high-resolution AFM studies despite their relevance to, e.g. energy applications. Here, we investigate the thermal noise limitations of dynamic AFM operation in both low and high viscosity environments theoretically, deriving expressions for the amplitude, phase and frequency noise resulting from the thermal motion of the cantilever, thereby defining the performance limits of amplitude modulation, phase modulation and frequency modulation AFM. We show that the assumption of a reduced SNR in viscous environments is not inherent to the technique and demonstrate that SNR values comparable to ultra-high vacuum systems can be obtained in high viscosity environments under certain conditions. Finally, we have obtained true atomic resolution images of highly ordered pyrolytic graphite and mica surfaces, thus revealing the potential of high-resolution imaging in high viscosity environments. (paper)

  11. Recent Progress in Molecular Recognition Imaging Using Atomic Force Microscopy.

    Science.gov (United States)

    Senapati, Subhadip; Lindsay, Stuart

    2016-03-15

    Atomic force microscopy (AFM) is an extremely powerful tool in the field of bionanotechnology because of its ability to image single molecules and make measurements of molecular interaction forces with piconewton sensitivity. It works in aqueous media, enabling studies of molecular phenomenon taking place under physiological conditions. Samples can be imaged in their near-native state without any further modifications such as staining or tagging. The combination of AFM imaging with the force measurement added a new feature to the AFM technique, that is, molecular recognition imaging. Molecular recognition imaging enables mapping of specific interactions between two molecules (one attached to the AFM tip and the other to the imaging substrate) by generating simultaneous topography and recognition images (TREC). Since its discovery, the recognition imaging technique has been successfully applied to different systems such as antibody-protein, aptamer-protein, peptide-protein, chromatin, antigen-antibody, cells, and so forth. Because the technique is based on specific binding between the ligand and receptor, it has the ability to detect a particular protein in a mixture of proteins or monitor a biological phenomenon in the native physiological state. One key step for recognition imaging technique is the functionalization of the AFM tips (generally, silicon, silicon nitrides, gold, etc.). Several different functionalization methods have been reported in the literature depending on the molecules of interest and the material of the tip. Polyethylene glycol is routinely used to provide flexibility needed for proper binding as a part of the linker that carries the affinity molecule. Recently, a heterofunctional triarm linker has been synthesized and successfully attached with two different affinity molecules. This novel linker, when attached to AFM tip, helped to detect two different proteins simultaneously from a mixture of proteins using a so-called "two

  12. Research on three dimensional machining effects using atomic force microscope.

    Science.gov (United States)

    Mao, Yao-Ting; Kuo, Kai-Chen; Tseng, Ching-En; Huang, Jian-Yin; Lai, Yi-Chih; Yen, Jia-Yush; Lee, Chih-Kung; Chuang, Wei-Li

    2009-06-01

    This research studies the use of scanning probe microscope as the tool to manufacture three dimensional nanoscale objects. We modified a commercial atomic force microscope (AFM) and replaced the original probe control system with a personal computer (PC) based controller. The modified system used the scanning probe in the AFM for the cutting tool and used the PC controller to control work piece. With the new controller, one could implement multiaxes motion control to perform trajectory planning and to test various cutting strategies. The experiments discovered that the debris can coalesce with the sample material and cause tremendous problem in the nanomachining process. This research thus proposed to make use of this material and developed a piling algorithm to not only cut but also pile up the debris in a favorable way for steric shaping. The experimental results showed that the proposed cutting and shaping algorithm can produce nano-objects as high as a few hundred nanometers. The probe tip typically wears down to around 500 microm diameter after the machining process, putting a limit on the machining resolution. The vertical resolution can achieve less than 10 nm without controlled environment. PMID:19566224

  13. Application of atomic force microscopy in blood research

    Institute of Scientific and Technical Information of China (English)

    Xiao-Long Ji; Ya-Min Ma; Tong Yin; Ming-Shi Shen; Xin Xu; Wei Guan

    2005-01-01

    AIM: To find suitable solutions having lesser granules and keeping erythrocytes in normal shapes under atomic force microscopy (AFM).METHODS: Eight kinds of solutions, 1% formaldehyde,PBS buffer (pH7.2), citrate buffer (pH6,0), 0.9% NaCl,5% dextrose, TAE, 1640 medium and 5% EDTA-K2, were selected from commonly used laboratory solutions, and venous blood from a healthy human volunteer was drawn and anticoagulated with EDTA-K2. Before scanned by AFM (NanoScopeⅢa SPM, Digital Instruments, Santa Barbara,CA), a kind of intermixture was deposited on freshly cleaved mica and then dried in the constant temperature cabinet (37 ℃).RESULTS: One percent formaldehyde, citrate buffer, 5%dextrose, TAE, were found to keep human erythrocytes in normal shape with few particles. Processed by these solutions, fine structures of human erythrocyte membrane were obtained.CONCLUSION: One percent formaldehyde, citrate buffer,5% dextrose and TAE may be applied to disposeerythrocytes in AFM. The results may offer meaningful data for clinical diagnosis of blood by AFM.

  14. Energy transfer between eigenmodes in multimodal atomic force microscopy

    International Nuclear Information System (INIS)

    We present experimental and computational investigations of tetramodal and pentamodal atomic force microscopy (AFM), respectively, whereby the first four or five flexural eigenmodes of the cantilever are simultaneously excited externally. This leads to six to eight additional observables in the form of amplitude and phase signals, with respect to the monomodal amplitude modulation method. We convert these additional observables into three or four dissipation and virial expressions, and show that these quantities can provide enhanced contrast that would otherwise remain hidden in the original observables. We also show that the complexity of the multimodal impact leads to significant energy transfer between the active eigenmodes, such that the dissipated power for individual eigenmodes may be positive or negative, while the total dissipated power remains positive. These results suggest that the contrast of individual eigenmodes in multifrequency AFM should be not be considered in isolation and that it may be possible to use different eigenfrequencies to probe sample properties that respond to different relaxation times. (paper)

  15. Simulating photoconductive atomic-force microscopy on disordered photovoltaic materials

    Science.gov (United States)

    Blakesley, James C.; Castro, Fernando A.

    2015-04-01

    We present a tool for simulating photoconductive atomic-force microscopy (Pc-AFM) on bulk heterojunction (BHJ) materials with a minimal set of empirical parameters. The simulation is a master-equation solution of a three-dimensional hopping charge transport model which includes donor-acceptor domain morphology, energetic and spatial disorder, exciton transport and splitting, charge-pair generation and recombination, and tip-substrate electrostatics. A simplifying aspect of the model is that electron transport, hole transport, and electron-hole recombination are treated as the same electron-transfer process. The model recreates realistic bulk recombination rates, without requiring short-range Coulombic effects to be calculated. We demonstrate the tool by simulating line scans of a Pc-AFM tip passing over the surface of a buried or exposed acceptor cluster in a BHJ film. The simulations confirm experimental observations that such defects can be detected by open-circuit mode Pc-AFM imaging, even when the clusters are buried below the surface.

  16. Morphological investigations of viscose fibers by atomic force microscopy

    International Nuclear Information System (INIS)

    Full text: Viscose fibers are used in textiles, hygiene products, and medical applications. The fibers are spun from a viscose solution of cellulose. Their cross-section is shaped by spinning the viscose solution through a spinneret, thus forming the fibers. The water absorption is an important property in the applications mentioned. Here, two samples of viscose fibers were investigated, which showed different behavior under water absorption. The samples were produced under similar conditions and therefore morphological investigations were of interest. In this study, the morphology of samples with high and low water absorption were compared. The surface was investigated by atomic force microscopy (AFM) in tapping mode. A comprehensive roughness analysis, including height-height correlation function (HHCF), showed no significant differences in the roughness parameters. On the surface of all samples, trenches could be observed and further investigation of these trenches was conducted. Depth and length distribution were similar, but the angle distribution, as well as trench density were different. From this result we conclude that the trench alignment and density are the main differences in morphology between the two ber types, which might explain their different water absorption. (author)

  17. Wide Stiffness Range Cavity Optomechanical Sensors for Atomic Force Microscopy

    CERN Document Server

    Liu, Yuxiang; Aksyuk, Vladimir; Srinivasan, Kartik

    2012-01-01

    We report on progress in developing compact sensors for atomic force microscopy (AFM), in which the mechanical transducer is integrated with near-field optical readout on a single chip. The motion of a nanoscale, doubly-clamped cantilever was transduced by an adjacent high quality factor silicon microdisk cavity. In particular, we show that displacement sensitivity on the order of 1 fm/(Hz)^(1/2) can be achieved while the cantilever stiffness is varied over four orders of magnitude (\\approx 0.01 N/m to \\approx 290 N/m). The ability to transduce both very soft and very stiff cantilevers extends the domain of applicability of this technique, potentially ranging from interrogation of microbiological samples (soft cantilevers) to imaging with high resolution (stiff cantilevers). Along with mechanical frequencies (> 250 kHz) that are much higher than those used in conventional AFM probes of similar stiffness, these results suggest that our cavity optomechanical sensors may have application in a wide variety of hig...

  18. Conductive-probe atomic force microscopy characterization of silicon nanowire

    Directory of Open Access Journals (Sweden)

    Yu Linwei

    2011-01-01

    Full Text Available Abstract The electrical conduction properties of lateral and vertical silicon nanowires (SiNWs were investigated using a conductive-probe atomic force microscopy (AFM. Horizontal SiNWs, which were synthesized by the in-plane solid-liquid-solid technique, are randomly deployed into an undoped hydrogenated amorphous silicon layer. Local current mapping shows that the wires have internal microstructures. The local current-voltage measurements on these horizontal wires reveal a power law behavior indicating several transport regimes based on space-charge limited conduction which can be assisted by traps in the high-bias regime (> 1 V. Vertical phosphorus-doped SiNWs were grown by chemical vapor deposition using a gold catalyst-driving vapor-liquid-solid process on higly n-type silicon substrates. The effect of phosphorus doping on the local contact resistance between the AFM tip and the SiNW was put in evidence, and the SiNWs resistivity was estimated.

  19. Characterizing atomic force microscopy tip shape in use.

    Science.gov (United States)

    Wang, Chunmei; Itoh, Hiroshi; Sun, Jielin; Hu, Jun; Shen, Dianhong; Ichimura, Shingo

    2009-02-01

    A new tip characterizer based on the fabrication of multilayer thin films for atomic force microscopy (AFM) was developed to analyze the effective tip shape while in use. The precise structure of this tip characterizer was measured by transmission electron microscopy. Four different types of commercial tips with various radii were characterized by the tip characterizer and by conventional scanning electron microscopy (SEM). The results were compared to obtain a relationship between the actual and effective tip shapes. A quantitative analysis was performed of apex radii measured from line profiles of comb-shaped patterns and nanometer-scale knife-edges without the problem of edge uncertainty in the SEM image. Degradation of the AFM tip induced by electron-beam irradiation was studied by using SEM and the tip characterizer. A potential technique for fabricating symmetric AFM tips based on irradiation by an electron beam and a quantitative analysis of changing the tip apex in SEM were examined with AFM using the tip characterizer. PMID:19441396

  20. Distributed force probe bending model of critical dimension atomic force microscopy bias

    Science.gov (United States)

    Ukraintsev, Vladimir A.; Orji, Ndubuisi G.; Vorburger, Theodore V.; Dixson, Ronald G.; Fu, Joseph; Silver, Rick M.

    2013-04-01

    Critical dimension atomic force microscopy (CD-AFM) is a widely used reference metrology technique. To characterize modern semiconductor devices, small and flexible probes, often 15 to 20 nm in diameter, are used. Recent studies have reported uncontrolled and significant probe-to-probe bias variation during linewidth and sidewall angle measurements. To understand the source of these variations, tip-sample interactions between high aspect ratio features and small flexible probes, and their influence on measurement bias, should be carefully studied. Using theoretical and experimental procedures, one-dimensional (1-D) and two-dimensional (2-D) models of cylindrical probe bending relevant to carbon nanotube (CNT) AFM probes were developed and tested. An earlier 1-D bending model was refined, and a new 2-D distributed force (DF) model was developed. Contributions from several factors were considered, including: probe misalignment, CNT tip apex diameter variation, probe bending before snapping, and distributed van der Waals-London force. A method for extracting Hamaker probe-surface interaction energy from experimental probe-bending data was developed. Comparison of the new 2-D model with 1-D single point force (SPF) model revealed a difference of about 28% in probe bending. A simple linear relation between biases predicted by the 1-D SPF and 2-D DF models was found. The results suggest that probe bending can be on the order of several nanometers and can partially explain the observed CD-AFM probe-to-probe variation. New 2-D and three-dimensional CD-AFM data analysis software is needed to take full advantage of the new bias correction modeling capabilities.

  1. Nano Scale Mechanical Analysis of Biomaterials Using Atomic Force Microscopy

    Science.gov (United States)

    Dutta, Diganta

    The atomic force microscope (AFM) is a probe-based microscope that uses nanoscale and structural imaging where high resolution is desired. AFM has also been used in mechanical, electrical, and thermal engineering applications. This unique technique provides vital local material properties like the modulus of elasticity, hardness, surface potential, Hamaker constant, and the surface charge density from force versus displacement curve. Therefore, AFM was used to measure both the diameter and mechanical properties of the collagen nanostraws in human costal cartilage. Human costal cartilage forms a bridge between the sternum and bony ribs. The chest wall of some humans is deformed due to defective costal cartilage. However, costal cartilage is less studied compared to load bearing cartilage. Results show that there is a difference between chemical fixation and non-chemical fixation treatments. Our findings imply that the patients' chest wall is mechanically weak and protein deposition is abnormal. This may impact the nanostraws' ability to facilitate fluid flow between the ribs and the sternum. At present, AFM is the only tool for imaging cells' ultra-structure at the nanometer scale because cells are not homogeneous. The first layer of the cell is called the cell membrane, and the layer under it is made of the cytoskeleton. Cancerous cells are different from normal cells in term of cell growth, mechanical properties, and ultra-structure. Here, force is measured with very high sensitivity and this is accomplished with highly sensitive probes such as a nano-probe. We performed experiments to determine ultra-structural differences that emerge when such cancerous cells are subject to treatments such as with drugs and electric pulses. Jurkat cells are cancerous cells. These cells were pulsed at different conditions. Pulsed and non-pulsed Jurkat cell ultra-structures were investigated at the nano meter scale using AFM. Jurkat cell mechanical properties were measured under

  2. Structural and nanomechanical properties of paperboard coatings studied by peak force tapping atomic force microscopy.

    Science.gov (United States)

    Sababi, Majid; Kettle, John; Rautkoski, Hille; Claesson, Per M; Thormann, Esben

    2012-10-24

    Paper coating formulations containing starch, latex, and clay were applied to paperboard and have been investigated by scanning electron microscopy and Peak Force tapping atomic force microscopy. A special focus has been on the measurement of the variation of the surface topography and surface material properties with a nanometer scaled spatial resolution. The effects of coating composition and drying conditions were investigated. It is concluded that the air-coating interface of the coating is dominated by close-packed latex particles embedded in a starch matrix and that the spatial distribution of the different components in the coating can be identified due to their variation in material properties. Drying the coating at an elevated temperature compared to room temperature changes the surface morphology and the surface material properties due to partial film formation of latex. However, it is evident that the chosen elevated drying temperature and exposure time is insufficient to ensure complete film formation of the latex which in an end application will be needed. PMID:22974234

  3. The atomic force (AFM), scanning tunneling (STM) and scanning force (SFM) microscopies

    International Nuclear Information System (INIS)

    This work deals with the atomic force (AFM), scanning tunneling (STM) and scanning force (SFM) microscopies. These analysis methods are based on different physical principles. Nevertheless, in all of them, a probe is situated at a few angstroms or at the direct contact of the studied sample and carries out a controlled scanning of the sample surface. Their physical principles and their running ways are described. Their potentialities and limits are given too. With these analysis methods, and more particularly with the AFM can be observed the crystal structure of isolated biological molecules and the tri dimensional structure of biological molecules which are inserted in artificial membranes. One of the future prospect of the AFM in biology is the direct observation of living cells. Indeed, it will offer the opportunity to follow, with time and in space, the individual cells behaviour and their morphological modifications. Others uses and developments of the AFM concerns the in situ analysis of mechanisms which govern the crystal growth or the direct viewing of a protein enzymatic activity. (O.M.). 37 refs., 7 figs

  4. Nanocharacterization of bio-silica using atomic force and ultrasonic force microscopy

    Science.gov (United States)

    Gill, Vinaypreet S.; Hallinan, Kevin P.; Brar, N. S.

    2005-04-01

    Nanotechnology has become central to our research efforts to fabricate relatively smaller size devices, which are more versatile than their older and larger predecessors. Silica is a very important material in this regard. Recently, a new biomimetically inspired path to silica production has been demonstrated. This processing technique was inspired from biological organisms, such as marine diatoms, which produce silica at ambient conditions and almost neutral ph with beautiful control over location and structure. Recently, several researchers have demonstrated that positional control of silica formed could be achieved by application of an electric field to locate charged enzymes responsible for the bio catalytic condensation of silica from solution. Secondly, chemical and physical controls of silica structural morphology were achievable. Atomic Force Microscopy (AFM) and Ultrasonic Force Microscopy (UFM) techniques are employed for the first time to provide both substantially improved resolution of the morphology and relative measurement of the modulus of elasticity of the structures. In particular, these measurements reveal the positive impact of a shear flow field present during the silica formation on both the "ordering" of the structure and the mechanical properties.

  5. Interaction forces between talc and pitch probed by atomic force microscopy.

    Science.gov (United States)

    Wallqvist, Viveca; Claesson, Per M; Swerin, Agne; Schoelkopf, Joachim; Gane, Patrick A C

    2007-04-10

    Colloidal wood resin components present in pulp are collectively called "pitch". The presence of pitch may cause severe problems due to deposits in and on the paper machine. There is thus a need for controlling pitch aggregation and adsorption. To be able to develop more efficient pitch control systems, one needs to develop the understanding of pitch-pitch interactions and of the interactions between pitch and other materials. With this general goal in mind, we present methods for preparing geometrically well-defined pitch particles attached to atomic force microscopy tips. This has enabled us to investigate the interactions between pitch and talc, an additive commonly used for pitch control. We have used model pitch particles consisting of one component only (abietic acid), a mixture of components (collophonium), and particles prepared from real pitch deposits. We show that the forces acting between pitch and talc are attractive and, once the initial approach is made, exert this attraction out to large distances of separation. We present evidence that the formation of bridging air bubbles or cavities is responsible for this interaction. PMID:17352501

  6. Immobilization of different biomolecules by atomic force microscopy

    Directory of Open Access Journals (Sweden)

    Hölzel Ralph

    2010-05-01

    Full Text Available Abstract Background Micrometer resolution placement and immobilization of probe molecules is an important step in the preparation of biochips and a wide range of lab-on-chip systems. Most known methods for such a deposition of several different substances are costly and only suitable for a limited number of probes. In this article we present a flexible procedure for simultaneous spatially controlled immobilization of functional biomolecules by molecular ink lithography. Results For the bottom-up fabrication of surface bound nanostructures a universal method is presented that allows the immobilization of different types of biomolecules with micrometer resolution. A supporting surface is biotinylated and streptavidin molecules are deposited with an AFM (atomic force microscope tip at distinct positions. Subsequent incubation with a biotinylated molecule species leads to binding only at these positions. After washing streptavidin is deposited a second time with the same AFM tip and then a second biotinylated molecule species is coupled by incubation. This procedure can be repeated several times. Here we show how to immobilize different types of biomolecules in an arbitrary arrangement whereas most common methods can deposit only one type of molecules. The presented method works on transparent as well as on opaque substrates. The spatial resolution is better than 400 nm and is limited only by the AFM's positional accuracy after repeated z-cycles since all steps are performed in situ without moving the supporting surface. The principle is demonstrated by hybridization to different immobilized DNA oligomers and was validated by fluorescence microscopy. Conclusions The immobilization of different types of biomolecules in high-density microarrays is a challenging task for biotechnology. The method presented here not only allows for the deposition of DNA at submicrometer resolution but also for proteins and other molecules of biological relevance that

  7. Contact resonances of U-shaped atomic force microscope probes

    International Nuclear Information System (INIS)

    Recent approaches used to characterize the elastic or viscoelastic properties of materials with nanoscale resolution have focused on the contact resonances of atomic force microscope (CR-AFM) probes. The experiments for these CR-AFM methods involve measurement of several contact resonances from which the resonant frequency and peak width are found. The contact resonance values are then compared with the noncontact values in order for the sample properties to be evaluated. The data analysis requires vibration models associated with the probe during contact in order for the beam response to be deconvolved from the measured spectra. To date, the majority of CR-AFM research has used rectangular probes that have a relatively simple vibration response. Recently, U-shaped AFM probes have created much interest because they allow local sample heating. However, the vibration response of these probes is much more complex such that CR-AFM is still in its infancy. In this article, a simplified analytical model of U-shaped probes is evaluated for contact resonance applications relative to a more complex finite element (FE) computational model. The tip-sample contact is modeled using three orthogonal Kelvin-Voigt elements such that the resonant frequency and peak width of each mode are functions of the contact conditions. For the purely elastic case, the frequency results of the simple model are within 8% of the FE model for the lowest six modes over a wide range of contact stiffness values. Results for the viscoelastic contact problem for which the quality factor of the lowest six modes is compared show agreement to within 13%. These results suggest that this simple model can be used effectively to evaluate CR-AFM experimental results during AFM scanning such that quantitative mapping of viscoelastic properties may be possible using U-shaped probes

  8. Contact resonances of U-shaped atomic force microscope probes

    Energy Technology Data Exchange (ETDEWEB)

    Rezaei, E.; Turner, J. A., E-mail: jaturner@unl.edu [Mechanical and Materials Engineering, University of Nebraska-Lincoln, W342 Nebraska Hall, Lincoln, Nebraska 68588 (United States)

    2016-01-21

    Recent approaches used to characterize the elastic or viscoelastic properties of materials with nanoscale resolution have focused on the contact resonances of atomic force microscope (CR-AFM) probes. The experiments for these CR-AFM methods involve measurement of several contact resonances from which the resonant frequency and peak width are found. The contact resonance values are then compared with the noncontact values in order for the sample properties to be evaluated. The data analysis requires vibration models associated with the probe during contact in order for the beam response to be deconvolved from the measured spectra. To date, the majority of CR-AFM research has used rectangular probes that have a relatively simple vibration response. Recently, U-shaped AFM probes have created much interest because they allow local sample heating. However, the vibration response of these probes is much more complex such that CR-AFM is still in its infancy. In this article, a simplified analytical model of U-shaped probes is evaluated for contact resonance applications relative to a more complex finite element (FE) computational model. The tip-sample contact is modeled using three orthogonal Kelvin-Voigt elements such that the resonant frequency and peak width of each mode are functions of the contact conditions. For the purely elastic case, the frequency results of the simple model are within 8% of the FE model for the lowest six modes over a wide range of contact stiffness values. Results for the viscoelastic contact problem for which the quality factor of the lowest six modes is compared show agreement to within 13%. These results suggest that this simple model can be used effectively to evaluate CR-AFM experimental results during AFM scanning such that quantitative mapping of viscoelastic properties may be possible using U-shaped probes.

  9. Autopilot for frequency-modulation atomic force microscopy

    Energy Technology Data Exchange (ETDEWEB)

    Kuchuk, Kfir; Schlesinger, Itai; Sivan, Uri, E-mail: phsivan@tx.technion.ac.il [Department of Physics and the Russell Berrie Nanotechnology Institute, Technion - Israel Institute of Technology, Haifa 32000 (Israel)

    2015-10-15

    One of the most challenging aspects of operating an atomic force microscope (AFM) is finding optimal feedback parameters. This statement applies particularly to frequency-modulation AFM (FM-AFM), which utilizes three feedback loops to control the cantilever excitation amplitude, cantilever excitation frequency, and z-piezo extension. These loops are regulated by a set of feedback parameters, tuned by the user to optimize stability, sensitivity, and noise in the imaging process. Optimization of these parameters is difficult due to the coupling between the frequency and z-piezo feedback loops by the non-linear tip-sample interaction. Four proportional-integral (PI) parameters and two lock-in parameters regulating these loops require simultaneous optimization in the presence of a varying unknown tip-sample coupling. Presently, this optimization is done manually in a tedious process of trial and error. Here, we report on the development and implementation of an algorithm that computes the control parameters automatically. The algorithm reads the unperturbed cantilever resonance frequency, its quality factor, and the z-piezo driving signal power spectral density. It analyzes the poles and zeros of the total closed loop transfer function, extracts the unknown tip-sample transfer function, and finds four PI parameters and two lock-in parameters for the frequency and z-piezo control loops that optimize the bandwidth and step response of the total system. Implementation of the algorithm in a home-built AFM shows that the calculated parameters are consistently excellent and rarely require further tweaking by the user. The new algorithm saves the precious time of experienced users, facilitates utilization of FM-AFM by casual users, and removes the main hurdle on the way to fully automated FM-AFM.

  10. Autopilot for frequency-modulation atomic force microscopy

    Science.gov (United States)

    Kuchuk, Kfir; Schlesinger, Itai; Sivan, Uri

    2015-10-01

    One of the most challenging aspects of operating an atomic force microscope (AFM) is finding optimal feedback parameters. This statement applies particularly to frequency-modulation AFM (FM-AFM), which utilizes three feedback loops to control the cantilever excitation amplitude, cantilever excitation frequency, and z-piezo extension. These loops are regulated by a set of feedback parameters, tuned by the user to optimize stability, sensitivity, and noise in the imaging process. Optimization of these parameters is difficult due to the coupling between the frequency and z-piezo feedback loops by the non-linear tip-sample interaction. Four proportional-integral (PI) parameters and two lock-in parameters regulating these loops require simultaneous optimization in the presence of a varying unknown tip-sample coupling. Presently, this optimization is done manually in a tedious process of trial and error. Here, we report on the development and implementation of an algorithm that computes the control parameters automatically. The algorithm reads the unperturbed cantilever resonance frequency, its quality factor, and the z-piezo driving signal power spectral density. It analyzes the poles and zeros of the total closed loop transfer function, extracts the unknown tip-sample transfer function, and finds four PI parameters and two lock-in parameters for the frequency and z-piezo control loops that optimize the bandwidth and step response of the total system. Implementation of the algorithm in a home-built AFM shows that the calculated parameters are consistently excellent and rarely require further tweaking by the user. The new algorithm saves the precious time of experienced users, facilitates utilization of FM-AFM by casual users, and removes the main hurdle on the way to fully automated FM-AFM.

  11. A metrological large range atomic force microscope with improved performance

    International Nuclear Information System (INIS)

    A metrological large range atomic force microscope (Met. LR-AFM) has been set up and improved over the past years at Physikalisch-Technische Bundesanstalt (PTB). Being designed as a scanning sample type instrument, the sample is moved in three dimensions by a mechanical ball bearing stage in combination with a compact z-piezostage. Its topography is detected by a position-stationary AFM head. The sample displacement is measured by three embedded miniature homodyne interferometers in the x, y, and z directions. The AFM head is aligned in such a way that its cantilever tip is positioned on the sample surface at the intersection point of the three interferometer measurement beams for satisfying the Abbe measurement principle. In this paper, further improvements of the Met. LR-AFM are reported. A new AFM head using the beam deflection principle has been developed to reduce the influence of parasitic optical interference phenomena. Furthermore, an off-line Heydemann correction method has been applied to reduce the inherent interferometer nonlinearities to less than 0.3 nm (p-v). Versatile scanning functions, for example, radial scanning or local AFM measurement functions, have been implemented to optimize the measurement process. The measurement software is also improved and allows comfortable operations of the instrument via graphical user interface or script-based command sets. The improved Met. LR-AFM is capable of measuring, for instance, the step height, lateral pitch, line width, nanoroughness, and other geometrical parameters of nanostructures. Calibration results of a one-dimensional grating and a set of film thickness standards are demonstrated, showing the excellent metrological performance of the instrument.

  12. Contact resonances of U-shaped atomic force microscope probes

    Science.gov (United States)

    Rezaei, E.; Turner, J. A.

    2016-01-01

    Recent approaches used to characterize the elastic or viscoelastic properties of materials with nanoscale resolution have focused on the contact resonances of atomic force microscope (CR-AFM) probes. The experiments for these CR-AFM methods involve measurement of several contact resonances from which the resonant frequency and peak width are found. The contact resonance values are then compared with the noncontact values in order for the sample properties to be evaluated. The data analysis requires vibration models associated with the probe during contact in order for the beam response to be deconvolved from the measured spectra. To date, the majority of CR-AFM research has used rectangular probes that have a relatively simple vibration response. Recently, U-shaped AFM probes have created much interest because they allow local sample heating. However, the vibration response of these probes is much more complex such that CR-AFM is still in its infancy. In this article, a simplified analytical model of U-shaped probes is evaluated for contact resonance applications relative to a more complex finite element (FE) computational model. The tip-sample contact is modeled using three orthogonal Kelvin-Voigt elements such that the resonant frequency and peak width of each mode are functions of the contact conditions. For the purely elastic case, the frequency results of the simple model are within 8% of the FE model for the lowest six modes over a wide range of contact stiffness values. Results for the viscoelastic contact problem for which the quality factor of the lowest six modes is compared show agreement to within 13%. These results suggest that this simple model can be used effectively to evaluate CR-AFM experimental results during AFM scanning such that quantitative mapping of viscoelastic properties may be possible using U-shaped probes.

  13. Molecular Dynamics Simulation of Atomic Force Microscopy at the Water-Muscovite Interface: Hydration Layer Structure and Force Analysis.

    Science.gov (United States)

    Kobayashi, Kazuya; Liang, Yunfeng; Amano, Ken-Ichi; Murata, Sumihiko; Matsuoka, Toshifumi; Takahashi, Satoru; Nishi, Naoya; Sakka, Tetsuo

    2016-04-19

    With the development of atomic force microscopy (AFM), it is now possible to detect the buried liquid-solid interfacial structure in three dimensions at the atomic scale. One of the model surfaces used for AFM is the muscovite surface because it is atomically flat after cleavage along the basal plane. Although it is considered that force profiles obtained by AFM reflect the interfacial structures (e.g., muscovite surface and water structure), the force profiles are not straightforward because of the lack of a quantitative relationship between the force and the interfacial structure. In the present study, molecular dynamics simulations were performed to investigate the relationship between the muscovite-water interfacial structure and the measured AFM force using a capped carbon nanotube (CNT) AFM tip. We provide divided force profiles, where the force contributions from each water layer at the interface are shown. They reveal that the first hydration layer is dominant in the total force from water even after destruction of the layer. Moreover, the lateral structure of the first hydration layer transcribes the muscovite surface structure. It resembles the experimentally resolved surface structure of muscovite in previous AFM studies. The local density profile of water between the tip and the surface provides further insight into the relationship between the water structure and the detected force structure. The detected force structure reflects the basic features of the atomic structure for the local hydration layers. However, details including the peak-peak distance in the force profile (force-distance curve) differ from those in the density profile (density-distance curve) because of disturbance by the tip. PMID:27018633

  14. AtomicJ: An open source software for analysis of force curves

    International Nuclear Information System (INIS)

    We present an open source Java application for analysis of force curves and images recorded with the Atomic Force Microscope. AtomicJ supports a wide range of contact mechanics models and implements procedures that reduce the influence of deviations from the contact model. It generates maps of mechanical properties, including maps of Young's modulus, adhesion force, and sample height. It can also calculate stacks, which reveal how sample's response to deformation changes with indentation depth. AtomicJ analyzes force curves concurrently on multiple threads, which allows for high speed of analysis. It runs on all popular operating systems, including Windows, Linux, and Macintosh

  15. Atomic Forces for Geometry-Dependent Point Multipole and Gaussian Multipole Models

    OpenAIRE

    Elking, Dennis M.; Perera, Lalith; Duke, Robert; Darden, Thomas; Pedersen, Lee G.

    2010-01-01

    In standard treatments of atomic multipole models, interaction energies, total molecular forces, and total molecular torques are given for multipolar interactions between rigid molecules. However, if the molecules are assumed to be flexible, two additional multipolar atomic forces arise due to 1) the transfer of torque between neighboring atoms, and 2) the dependence of multipole moment on internal geometry (bond lengths, bond angles, etc.) for geometry-dependent multipole models. In the curr...

  16. Radiation forces on a three-level atom in the high-order Bessel beams

    Institute of Scientific and Technical Information of China (English)

    Wang Zheng-Ling; Yin Jian-Ping

    2008-01-01

    The general expressions of the average dissipative and dipole forces acting on a A-configuration three-level atom in an arbitrary light field are derived by means of the optical Bloch equations based on the atomic density matrix elements, and the general properties of the average dissipative and dipole forces on a three-level atom in the linearly-polarized high-order Bessel beams (HBBs) are analysed. We find a resonant property (with two resonant peaks) of the dissipative force and a non-resonant property (with two pairs of non-resonant peaks) of the dipole force on the three-level atom, which are completely different from those on the two-level atom. Meanwhile we find a saturation effect of the average dissipative force in the HBB, which comes from the saturation of the upper-level population. Our study shows that the general expressions of the average dissipative and dipole forces on the three-level atom will be simplified to those of the two-level atom under the approximation of large detuning. Finally, we study the axial and azimuthal Doppler cooling of atoms in 1D optical molasses composed of two counter-propagating HBBs and discuss the azimuthal influence of the HBB on the Doppler cooling limit. We also find that the Doppler limit of atoms in the molasses HBB is slightly below the conventional Doppler limit of hг/(2кB) due to the orbital angular momentum lh of the HBB.

  17. Force on a neutral atom near conducting microstructures

    OpenAIRE

    Eberlein, Claudia; Zietal, Robert

    2006-01-01

    We derive the nonretarded energy shift of a neutral atom for two different geometries. For an atom close to a cylindrical wire we find an integral representation for the energy shift, give asymptotic expressions, and interpolate numerically. For an atom close to a semi-infinite half plane we determine the exact Green's function of the Laplace equation and use it to derive the exact energy shift for an arbitrary position of the atom. These results can be used to estimate the energy shift of an...

  18. Optimization of adhesion mode atomic force microscopy resolves individual molecules in topography and adhesion

    NARCIS (Netherlands)

    Willemsen, O.H.; Snel, M.M.E.; Noort, van S.J.T.; Werf, van der K.O.; Grooth, de B.G.; Figdor, C.G.; Greve, J.

    1999-01-01

    The force sensor of an atomic force microscope (AFM) is sensitive enough to measure single molecular binding strengths by means of a force–distance curve. In order to combine high-force sensitivity with the spatial resolution of an AFM in topography mode, adhesion mode has been developed. Since this

  19. A new united atom force field for adsorption of alkenes in zeolites

    NARCIS (Netherlands)

    B. Liu; B. Smit; F. Rey; S. Valencia; S. Calero

    2008-01-01

    A new united atom force field was developed that accurately describes the adsorption properties of linear alkenes in zeolites. The force field was specifically designed for use in the inhomogeneous system and therefore a truncated and shifted potential was used. With the determined force field, we p

  20. Amplitude modulation Atomic Force Microscopy, is acoustic driving in liquid quantitatively reliable?

    NARCIS (Netherlands)

    Liu, F.; Zhao, C.; Mugele, F.; Ende, van den H.T.M.

    2015-01-01

    Measuring quantitative tip–sample interaction forces in dynamic atomic force microscopy in fluids is challenging because of the strong damping of the ambient viscous medium and the fluid-mediated driving forces. This holds in particular for the commonly used acoustic excitation of the cantilever osc

  1. Local Rheology of Human Neutrophils Investigated Using Atomic Force Microscopy

    Directory of Open Access Journals (Sweden)

    Yong J. Lee, Dipika Patel, Soyeun Park

    2011-01-01

    Full Text Available During the immune response, neutrophils display localized mechanical events by interacting with their environment through the micro-vascular transit, trans-endothelial, and trans-epithelial migration. Nano-mechanical studies of human neutrophils on localized nano-domains could provide the essential information for understanding their immune responsive functions. Using the Atomic Force Microscopy (AFM - based micro-rheology, we have investigated rheological properties of the adherent human neutrophils on local nano-domains. We have applied the modified Hertz model to obtain the viscoelastic moduli from the relatively thick body regions of the neutrophils. In addition, by using more advanced models to account for the substrate effects, we have successfully characterized the rheological properties of the thin leading and tail regions as well. We found a regional difference in the mechanical compliances of the adherent neutrophils. The central regions of neutrophils were significantly stiffer (1,548 ± 871 Pa than the regions closer to the leading edge (686 ± 801 Pa, while the leading edge and the tail (494 ± 537 Pa regions were mechanically indistinguishable. The frequency-dependent elastic and viscous moduli also display a similar regional difference. Over the studied frequency range (100 to 300 Hz, the complex viscoelastic moduli display the partial rubber plateau behavior where the elastic moduli are greater than the viscous moduli for a given frequency. The non-disparaging viscous modulus indicates that the neutrophils display a viscoelastic dynamic behavior rather than a perfect elastic behavior like polymer gels. In addition, we found no regional difference in the structural damping coefficient between the leading edge and the cell body. Thus, we conclude that despite the lower loss and storage moduli, the leading edges of the human neutrophils display partially elastic properties similar to the cell body. These results suggest that the

  2. Surface microstructure of bitumen characterized by atomic force microscopy.

    Science.gov (United States)

    Yu, Xiaokong; Burnham, Nancy A; Tao, Mingjiang

    2015-04-01

    Bitumen, also called asphalt binder, plays important roles in many industrial applications. It is used as the primary binding agent in asphalt concrete, as a key component in damping systems such as rubber, and as an indispensable additive in paint and ink. Consisting of a large number of hydrocarbons of different sizes and polarities, together with heteroatoms and traces of metals, bitumen displays rich surface microstructures that affect its rheological properties. This paper reviews the current understanding of bitumen's surface microstructures characterized by Atomic Force Microscopy (AFM). Microstructures of bitumen develop to different forms depending on crude oil source, thermal history, and sample preparation method. While some bitumens display surface microstructures with fine domains, flake-like domains, and dendrite structuring, 'bee-structures' with wavy patterns several micrometers in diameter and tens of nanometers in height are commonly seen in other binders. Controversy exists regarding the chemical origin of the 'bee-structures', which has been related to the asphaltene fraction, the metal content, or the crystallizing waxes in bitumen. The rich chemistry of bitumen can result in complicated intermolecular associations such as coprecipitation of wax and metalloporphyrins in asphaltenes. Therefore, it is the molecular interactions among the different chemical components in bitumen, rather than a single chemical fraction, that are responsible for the evolution of bitumen's diverse microstructures, including the 'bee-structures'. Mechanisms such as curvature elasticity and surface wrinkling that explain the rippled structures observed in polymer crystals might be responsible for the formation of 'bee-structures' in bitumen. Despite the progress made on morphological characterization of bitumen using AFM, the fundamental question whether the microstructures observed on bitumen surfaces represent its bulk structure remains to be addressed. In addition

  3. Force modulation atomic force microscopy: background, development and application to electrodeposited cerium oxide films

    Science.gov (United States)

    Li, Feng-Bin; Thompson, G. E.; Newman, R. C.

    1998-04-01

    In force modulation atomic force microscopy (FMAFM), vertical oscillation of the scanning tip of the AFM is added purposely and the deflection of the tip, which is influenced by surface features of the sample, is used as the z dimension to construct images. FMAFM represents a powerful technique for scientific research, but its merit has not been realized adequately to date. In this paper, the basic principles and particular features, as well as potential drawbacks of the technique, are presented and demonstrated systematically, through its application to electrochemically deposited cerium oxide films. Comparisons are also made with the more familiar contact mode AFM (CMAFM) and tapping mode AFM (TMAFM). It is shown that FMAFM reveals the major topographic features of CMAFM, but affords (i) greater resolution for sample features that are difficult in CMAFM, and (ii) continuous two-dimensional mapping of local mechanical properties on a scale of nanometres that the CMAFM, TMAFM and any other techniques, are not capable of sensing. This information can be used to elucidate other properties of the investigated surface, such as crystallinity variation, phase separation and distribution, and mechanisms of formation of deposited films. Major artifacts associated with the technique include `wedge cavity effect' and `tip slip effect', for which a geometric model is proposed to elucidate their origins. The cerium oxide films are shown to be composed of relatively hard crystalline grains, of well-defined individual geometry and comparatively regular packing, alongside relatively soft amorphous patches, devoid of distinct geometry and assembled disorderly. These features are consistent with a nucleation and growth mechanism of the deposition, in which crystalline nuclei arise and grow from an intermediate cerium gel mass, produced in the interfacial region during deposition.

  4. Directional spontaneous emission and lateral Casimir-Polder force on an atom close to a nanofiber

    Science.gov (United States)

    Scheel, Stefan; Buhmann, Stefan Yoshi; Clausen, Christoph; Schneeweiss, Philipp

    2015-10-01

    We study the spontaneous emission of an excited atom close to an optical nanofiber and the resulting scattering forces. For a suitably chosen orientation of the atomic dipole, the spontaneous emission pattern becomes asymmetric and a resonant Casimir-Polder force parallel to the fiber axis arises. For a simple model case, we show that such a lateral force is due to the interaction of the circularly oscillating atomic dipole moment with its image inside the material. With the Casimir-Polder energy being constant in the lateral direction, the predicted lateral force does not derive from a potential in the usual way. Our results have implications for optical force measurements on a substrate as well as for laser cooling of atoms in nanophotonic traps.

  5. Submolecular imaging with single particle atomic force sensors

    OpenAIRE

    Kichin, Georgy

    2014-01-01

    Scanning probe methods with decorated tips is a new trend in surface study. An application of complex probe like a tip with an attached single molecule or single atom allows to get new details about the surface properties. It has been shown that the scanning tunnelling hydrogen microscopy (STHM) approach can reach atomic scale resolution and reveals intermolecular interactions. Because of the complexity, this new rapidly developing area is not yet fully understood. In this work systematic stu...

  6. Automation of the CHARMM General Force Field (CGenFF) I: bond perception and atom typing

    OpenAIRE

    Vanommeslaeghe, K.; MacKerell, A.D.

    2012-01-01

    Molecular mechanics force fields are widely used in computer-aided drug design for the study of drug-like molecules alone or interacting with biological systems. In simulations involving biological macromolecules, the biological part is typically represented by a specialized biomolecular force field, while the drug is represented by a matching general (organic) force field. In order to apply these general force fields to an arbitrary drug-like molecule, functionality for assignment of atom ty...

  7. Mapping power-law rheology of living cells using multi-frequency force modulation atomic force microscopy

    International Nuclear Information System (INIS)

    We present multi-frequency force modulation atomic force microscopy (AFM) for mapping the complex shear modulus G* of living cells as a function of frequency over the range of 50–500 Hz in the same measurement time as the single-frequency force modulation measurement. The AFM technique enables us to reconstruct image maps of rheological parameters, which exhibit a frequency-dependent power-law behavior with respect to G*. These quantitative rheological measurements reveal a large spatial variation in G* in this frequency range for single cells. Moreover, we find that the reconstructed images of the power-law rheological parameters are much different from those obtained in force-curve or single-frequency force modulation measurements. This indicates that the former provide information about intracellular mechanical structures of the cells that are usually not resolved with the conventional force measurement methods

  8. Mapping power-law rheology of living cells using multi-frequency force modulation atomic force microscopy

    Energy Technology Data Exchange (ETDEWEB)

    Takahashi, Ryosuke; Okajima, Takaharu, E-mail: okajima@ist.hokudai.ac.jp [Graduate School of Information Science and Technology, Hokkaido University, Kita-ku N14 W9, Sapporo 060-0814 (Japan)

    2015-10-26

    We present multi-frequency force modulation atomic force microscopy (AFM) for mapping the complex shear modulus G* of living cells as a function of frequency over the range of 50–500 Hz in the same measurement time as the single-frequency force modulation measurement. The AFM technique enables us to reconstruct image maps of rheological parameters, which exhibit a frequency-dependent power-law behavior with respect to G{sup *}. These quantitative rheological measurements reveal a large spatial variation in G* in this frequency range for single cells. Moreover, we find that the reconstructed images of the power-law rheological parameters are much different from those obtained in force-curve or single-frequency force modulation measurements. This indicates that the former provide information about intracellular mechanical structures of the cells that are usually not resolved with the conventional force measurement methods.

  9. The resistive switching in TiO2 films studied by conductive atomic force microscopy and Kelvin probe force microscopy

    OpenAIRE

    Yuanmin Du; Amit Kumar; Hui Pan; Kaiyang Zeng; Shijie Wang; Ping Yang; Andrew Thye Shen Wee

    2013-01-01

    The resistive switching characteristics of TiO2 thin films were investigated using conductive atomic force microscopy (CAFM) and Kelvin probe force microscopy (KPFM). The as-prepared TiO2 thin films were modulated into higher and lower resistance states by applying a local electric field. We showed that the resistive switching results from charge injection and release assisted by electro-migration of oxygen ions. An integrated model combined with filamentary and interfacial effects was utiliz...

  10. High-sensitivity detection of proteins using gel electrophoresis and atomic force microscopy

    International Nuclear Information System (INIS)

    We have developed a method to detect specific proteins with a high sensitivity using a gel electrophoresis method and force measurement of atomic force microscopy (AFM). Biotinylated proteins were separated by electrophoresis and fixed with cross-linking chemicals on the gel, followed by direct force measurement between the biotinylated proteins on the gel and a streptavidin-modified tip of an AFM cantilever. We were able to achieve a high enough sensitivity to detect the picogram order of the biotinylated proteins by evaluating the frequency of the interaction force larger than 100 pN in the force profile, which corresponds to the rupture force of interaction between streptavidin and biotin.

  11. Atom-wall dispersive forces from master equation formalism

    CERN Document Server

    Mendes, T N C

    2007-01-01

    Using the general expressions for level shifts obtained from the master equation for a small system interacting with a large one considered as a reservoir, we calculate the dispersive potentials between an atom and a wall in the dipole approximation. We analyze in detail the particular case of a two-level atom in the presence of a perfectly conducting wall. We study the van der Waals as well as the resonant interactions. All distance regimes as well as the high and low temperature regimes are considered. We show that the Casimir-Polder interaction can not be considered as a direct result of the vacuum fluctuations only. Concerning the interaction between the atom and the wall at high temperature, which show that a saturation of the potential for all distances occurs. This saturated potential coincides exactly with that obtained in the London-van der Waals limit.

  12. Atom-wall dispersive forces from master equation formalism

    OpenAIRE

    Mendes, T. N. C.; Farina, C.

    2007-01-01

    Using the general expressions for level shifts obtained from the master equation for a small system interacting with a large one considered as a reservoir, we calculate the dispersive potentials between an atom and a wall in the dipole approximation. We analyze in detail the particular case of a two-level atom in the presence of a perfectly conducting wall. We study the van der Waals as well as the resonant interactions. All distance regimes as well as the high and low temperature regimes are...

  13. Simultaneous atomic force- and scanning tunneling microscopy - a new view on two distinct aspects of the atomic structure of matter

    International Nuclear Information System (INIS)

    Full text: Full text: Frequency-modulation AFM can be combined with scanning tunneling microscopy, yielding a simultaneous data set for current and average force gradient. Ternes et al. have shown that for some metallic contacts, force and current are proportional. The figure shows an example, where combined AFM/STM reveals two strongly distinct aspects of the atomic structure of matter. The gray veil depicts the inverted tunneling current between a CO molecule adsorbed on Cu(111) and a tungsten tip, while the colored surface shows the corresponding force profiles, where the left image corresponds to a W tip oriented in a direction, the right to a direction and the bottom to a direction. While the simultaneous acquisition of current and force can reveal new information about the atomic and electronic structure of matter, the tunneling current can modify the atomic forces. This phantom force, a modification of the electrostatic attraction between tip and sample, originates in an alteration of the effective potential difference between tip and sample caused by strongly localized voltage drop induced by the tunneling current. The talk discusses the merits of combined STM/AFM as well as the challenges, in particular with respect to tip preparation and characterization. (author)

  14. Casimir-Polder forces on atoms in the presence of magnetoelectronic bodies

    Energy Technology Data Exchange (ETDEWEB)

    Buhmann, S.Y.

    2007-07-05

    In this work, the CP force between a single neutral atom or molecule and neutral magnetoelectric bodies is studied. The focus lies on the pure vacuum CP force, i.e., the electromagnetic field is in general understood to be in its ground state. Furthermore, we assume that the atom-body separation is sufficiently large to ensure that the atom is adequately characterised as an electric dipole, while the body can be described by its macroscopic magnetoelectric properties; and that repulsive exchange forces due to the overlap between the electronic wave functions of the atom and the bodies can be neglected. Interactions due to non-vanishing net charges, permanent electric dipole moments, magnetisability, quadrupole (or higher multipole) polarisabilities of the atom and those resulting from non-local or anisotropic magnetoelectric properties of the bodies are ignored. (orig.)

  15. Nano-rheology of hydrogels using direct drive force modulation atomic force microscopy.

    Science.gov (United States)

    Nalam, Prathima C; Gosvami, Nitya N; Caporizzo, Matthew A; Composto, Russell J; Carpick, Robert W

    2015-11-01

    We present a magnetic force-based direct drive modulation method to measure local nano-rheological properties of soft materials across a broad frequency range (10 Hz to 2 kHz) using colloid-attached atomic force microscope (AFM) probes in liquid. The direct drive method enables artefact-free measurements over several decades of excitation frequency, and avoids the need to evaluate medium-induced hydrodynamic drag effects. The method was applied to measure the local mechanical properties of polyacrylamide hydrogels. The frequency-dependent storage stiffness, loss stiffness, and loss tangent (tan δ) were quantified for hydrogels having high and low crosslinking densities by measuring the amplitude and the phase response of the cantilever while the colloid was in contact with the hydrogel. The frequency bandwidth was further expanded to lower effective frequencies (0.1 Hz to 10 Hz) by obtaining force-displacement (FD) curves. Slow FD measurements showed a recoverable but highly hysteretic response, with the contact mechanical behaviour dependent on the loading direction: approach curves showed Hertzian behaviour while retraction curves fit the JKR contact mechanics model well into the adhesive regime, after which multiple detachment instabilities occurred. Using small amplitude dynamic modulation to explore faster rates, the load dependence of the storage stiffness transitioned from Hertzian to a dynamic punch-type (constant contact area) model, indicating significant influence of material dissipation coupled with adhesion. Using the appropriate contact model across the full frequency range measured, the storage moduli were found to remain nearly constant until an increase began near ∼100 Hz. The softer gels' storage modulus increased from 7.9 ± 0.4 to 14.5 ± 2.1 kPa (∼85%), and the stiffer gels' storage modulus increased from 16.3 ± 1.1 to 31.7 ± 5.0 kPa (∼95%). This increase at high frequencies may be attributed to a contribution from solvent

  16. Differentiating inclusion complexes from host molecules by tapping-mode atomic force microscopy.

    OpenAIRE

    Muñoz-Botella, S; Martin, M A; del Castillo, B; Vázquez, L.

    1996-01-01

    Tapping-mode atomic force microscopy imaging under different cantilever vibration amplitudes has been used to differentiate the host beta-cyclodextrin nanotubes from retinal/beta-cyclodextrin inclusion complex nanotubes. It was observed that both compounds were deformed differently by the applied probe force because of their different local rigidity. This change in the elasticity properties can be explained as a consequence of the inclusion process. This method shows that tapping-mode atomic ...

  17. Tapping-mode atomic force microscopy produces faithful high-resolution images of protein surfaces.

    OpenAIRE

    Möller, C; Allen, M.; Elings, V; Engel, A.; Müller, D J

    1999-01-01

    Compared to contact-mode atomic force microscopy (CMAFM), tapping-mode atomic force microscopy (TMAFM) has the advantage of allowing imaging surfaces of macromolecules, even when they are only weakly attached to the support. In this study, TMAFM is applied to two different regular protein layers whose structures are known to great detail, the purple membrane from Halobacterium salinarum and the hexagonally packed intermediate (HPI) layer from Deinococcus radiodurans, to assess the faithfulnes...

  18. Synthetic Lorentz force in classical atomic gases via Doppler effect and radiation pressure

    CERN Document Server

    Dubček, T; Jukić, D; Aumiler, D; Ban, T; Buljan, H

    2014-01-01

    We theoretically predict a novel type of synthetic Lorentz force for classical (cold) atomic gases, which is based on the Doppler effect and radiation pressure. A fairly uniform and strong force can be constructed for gases in macroscopic volumes of several cubic millimeters and more. This opens the possibility to mimic classical charged gases in magnetic fields, such as those in a tokamak, in cold atom experiments.

  19. Analysis of Immunolabeled Cells by Atomic Force Microscopy, Optical Microscopy, and Flow Cytometry

    OpenAIRE

    Neagu, C.; Werf, van der, W.; Putman, C.A.J.; Kraan, Y.M.; Grooth, de, B.G.; Hulst, van der, R.W.M.; Greve, J de

    1994-01-01

    In this study we investigated the applicability of the (silver- enhanced) immunogold labeling method for atomic force microscopy. Human lymphocytes were labeled with anti-CD3 conjugated to fluorescein isothiocyanate and a secondary antibody (goat anti-mouse) linked with 1- or 30-nm colloidal gold particles. Silver enhancement was applied o­n these labeled cells to increase the size of the labels. In a setup combining an inverted optical microscope and a stand-alone atomic force microscope, a ...

  20. Measurements of elastic modulus for human anterior lens capsule with atomic force microscopy: the effect of loading force.

    Science.gov (United States)

    Tsaousis, Konstantinos T; Karagiannidis, Panagiotis G; Kopsachilis, Nikolaos; Symeonidis, Chrysanthos; Tsinopoulos, Ioannis T; Karagkiozaki, Varvara; Lamprogiannis, Lampros P; Logothetidis, Stergios

    2014-06-01

    The purpose of the study was to appraise the effect of loading force magnitude on the determination of the elastic modulus of the anterior lens capsule through atomic force microscopy. Four human anterior lens capsules taken during phacoemulsification cataract surgery were studied, free of epithelial cells, with atomic force microscopy. For the experiment, five different indentation loading forces were applied to near areas of the specimen. Experimental data was exported and analyzed according to the Hertz model to obtain the Young's modulus with regards to the elastic behavior of the material. Force-distance curves were acquired by applying a load of 2, 5, 10, 20 and 30 nN. When examining the results it was evident that determination of Young's modulus of the anterior lens capsule is dependent on the loading force concerning the examined range. Loading forces of 10 and 20 nN led to results without significant difference (p > 0.05) and more reproducible (coefficients of variation 12.4 and 11.7 %, respectively). PMID:24037592

  1. Influence of electrostatic forces on the investigation of dopant atoms in layered semiconductors by scanning tunneling microscopy/spectroscopy and atomic force microscopy

    International Nuclear Information System (INIS)

    Investigation of the atomic scale topography and electronic structure of dopant sites in semiconductor materials is a promising application of scanning probe microscopies. Dopants have been imaged with scanning tunneling microscopy (STM) on and near the surface of conventional semiconductor materials as well as on layered compounds. On both kinds of materials, dopants are detected as either protrusions or depressions in the STM image. The comparison of the measured heights between the materials shows that the values on layered materials are considerably larger than those on the conventional (three-dimensional) semiconductors. We interpret this as the influence of dopant induced electrostatic forces between the tip and sample leading to a structural deformation of the surface around dopant atoms. In order to investigate the influence of electrostatic forces, we performed STM measurements on p-type MoS2 at different bias voltages. The bias dependence of the images indicates the presence of electrostatic forces and demonstrates the influence of screening due to the surrounding electron density. Additional measurements with current imaging tunneling spectroscopy show that changes in the density of states at dopant sites plays only a minor role and cannot account for the large protrusions observed. Atomic force microscopy measurements, with an applied dc voltage between cantilever and sample, also confirm the role of electrostatic forces since voltage dependent changes in the topograpy were observed. copyright 1997 American Vacuum Society

  2. Four-Color Stimulated Optical Forces for Atomic and Molecular Slowing

    CERN Document Server

    Galica, S E; Eyler, E E

    2013-01-01

    Stimulated optical forces offer a simple and efficient method for providing optical forces far in excess of the saturated radiative force. The bichromatic force, using a counterpropagating pair of two-color beams, has so far been the most effective of these stimulated forces for deflecting and slowing atomic beams. We have numerically studied the evolution of a two-level system under several different bichromatic and polychromatic light fields, while retaining the overall geometry of the bichromatic force. New insights are gained by studying the time-dependent trajectory of the Bloch vector, including a better understanding of the remarkable robustness of bi- and polychromatic forces with imbalanced beam intensities. We show that a four-color polychromatic force exhibits great promise. By adding new frequency components at the third harmonic of the original bichromatic detuning, the force is increased by nearly 50% and its velocity range is extended by a factor of three, while the required laser power is incr...

  3. Surface structure of polymers and their model compounds observed by atomic force microscopy

    NARCIS (Netherlands)

    Stocker, W.; Bickmann, B.; Magonov, S.N.; Cantow, H.-J.; Lotz, B.; Wittmann, J.-C.; Möller, M.

    1992-01-01

    Results of atomic force microscopy (AFM) of normal alkanes, polyethylene, isotactic polypropylene and of a diblock copolymer are presented. Various types of surfaces - naturally and epitaxially grown on different substrates - have been examined from hundreds of nanometers down to the atomic scale. S

  4. Nonequilibrium forces between atoms and dielectrics mediated by a quantum field

    International Nuclear Information System (INIS)

    In this paper we give a first principles microphysics derivation of the nonequilibrium forces between an atom, treated as a three-dimensional harmonic oscillator, and a bulk dielectric medium modeled as a continuous lattice of oscillators coupled to a reservoir. We assume no direct interaction between the atom and the medium but there exist mutual influences transmitted via a common electromagnetic field. By employing concepts and techniques of open quantum systems we introduce coarse-graining to the physical variables--the medium, the quantum field, and the atom's internal degrees of freedom, in that order--to extract their averaged effects from the lowest tier progressively to the top tier. The first tier of coarse-graining provides the averaged effect of the medium upon the field, quantified by a complex permittivity (in the frequency domain) describing the response of the dielectric to the field in addition to its back action on the field through a stochastic forcing term. The last tier of coarse-graining over the atom's internal degrees of freedom results in an equation of motion for the atom's center of mass from which we can derive the force on the atom. Our nonequilibrium formulation provides a fully dynamical description of the atom's motion including back-action effects from all other relevant variables concerned. In the long-time limit we recover the known results for the atom-dielectric force when the combined system is in equilibrium or in a nonequilibrium stationary state.

  5. Noncontact atomic force and Kelvin probe force microscopy on MgO(100) and MgO(100)-supported Ba

    Science.gov (United States)

    Pang, Chi Lun; Sasahara, Akira; Onishi, Hiroshi

    2016-08-01

    Atomically-flat MgO(100) surfaces were prepared by sputtering and annealing. Noncontact atomic force microscopy (NC-AFM) and Kelvin probe force microscopy (KPFM) were used to characterize the MgO(100) surfaces. The NC-AFM images revealed the presence of point defects on an atomically-resolved surface. The surface potential at these point defects, as well as features such as step edges and deposited Ba nanoparticles were mapped using KPFM. The Kelvin images show that the surface potential increases at the point defects and at the step edges. On the other hand, a decrease in the potential was found over Ba nanoparticles which can be explained by electron charge transfer from the Ba to the MgO.

  6. Torque and atomic forces for Cartesian tensor atomic multipoles with an application to crystal unit cell optimization.

    Science.gov (United States)

    Elking, Dennis M

    2016-08-15

    New equations for torque and atomic force are derived for use in flexible molecule force fields with atomic multipoles. The expressions are based on Cartesian tensors with arbitrary multipole rank. The standard method for rotating Cartesian tensor multipoles and calculating torque is to first represent the tensor with n indexes and 3(n) redundant components. In this work, new expressions for directly rotating the unique (n + 1)(n + 2)/2 Cartesian tensor multipole components Θpqr are given by introducing Cartesian tensor rotation matrix elements X(R). A polynomial expression and a recursion relation for X(R) are derived. For comparison, the analogous rotation matrix for spherical tensor multipoles are the Wigner functions D(R). The expressions for X(R) are used to derive simple equations for torque and atomic force. The torque and atomic force equations are applied to the geometry optimization of small molecule crystal unit cells. In addition, a discussion of computational efficiency as a function of increasing multipole rank is given for Cartesian tensors. © 2016 Wiley Periodicals, Inc. PMID:27349179

  7. The Polarizable Atomic Multipole-based AMOEBA Force Field for Proteins

    OpenAIRE

    Shi, Yue; Xia, Zhen; Zhang, Jiajing; Best, Robert; Wu, Chuanjie; Ponder, Jay W.; Ren, Pengyu

    2013-01-01

    Development of the AMOEBA (Atomic Multipole Optimized Energetics for Biomolecular Simulation) force field for proteins is presented. The current version (AMOEBA-2013) utilizes permanent electrostatic multipole moments through the quadrupole at each atom, and explicitly treats polarization effects in various chemical and physical environments. The atomic multipole electrostatic parameters for each amino acid residue type are derived from high-level gas phase quantum mechanical calculations via...

  8. Origin of current-induced forces in an atomic gold wire: A first-principles study

    DEFF Research Database (Denmark)

    Brandbyge, Mads; Stokbro, Kurt; Taylor, Jeremy Philip;

    2003-01-01

    We address the microscopic origin of the current-induced forces by analyzing results of first principles density functional calculations of atomic gold wires connected to two gold electrodes with different electrochemical potentials. We find that current induced forces are closely related to the ...

  9. A Physical Approach to Reduce Nonspecific Adhesion in Molecular Recognition Atomic Force Microscopy

    NARCIS (Netherlands)

    Willemsen, Oscar H.; Snel, Margot M.E.; Kuipers, Laurens; Figdor, Carl G.; Greve, J.; Grooth, de Bart G.

    1999-01-01

    Atomic force microscopy is one of the few techniques that allow analysis of biological recognition processes at the single-molecule level. A major limitation of this approach is the nonspecific interaction between the force sensor and substrate. We have modeled the nonspecific interaction by looking

  10. The role of the atomic force function in molecular mechanics simulations for carbon nanostructures

    International Nuclear Information System (INIS)

    Molecular mechanics studies were performed on structures consisting of Y junctions of carbon nanotubes. Tensile simulations were run on the same structure, wherein atomic force functions of various shape were used. According to the numerical test results the behavior of the structure, the failure site and the failure process could be determined irrespective of the shape of the force function

  11. Imaging three-dimensional surface objects with submolecular resolution by atomic force microscopy

    Czech Academy of Sciences Publication Activity Database

    Moreno, C.; Stetsovych, Oleksandr; Shimizu, T.K.; Custance, O.

    2015-01-01

    Roč. 15, č. 4 (2015), s. 2257-2262. ISSN 1530-6984 Institutional support: RVO:68378271 Keywords : noncontact atomic force microscopy (NC-AFM) * submolecular resolution * three-dimensional dynamic force spectroscopy * high-resolution imaging Subject RIV: BM - Solid Matter Physics ; Magnetism Impact factor: 13.592, year: 2014

  12. Dynamical Casimir–Polder force on a partially dressed atom in a cavity comprising a dielectric

    Energy Technology Data Exchange (ETDEWEB)

    Yang, H.; Zheng, T.Y., E-mail: zhengty@nenu.edu.cn; Zhang, X.; Shao, X.Q.; Pan, S.M., E-mail: pansm717@nenu.edu.cn

    2014-05-15

    We put a two-level atom into a cavity comprising a dielectric with output coupling. An analytical expression of the dynamical Casimir–Polder force in such a system is obtained when the system starts from a partially dressed state. And the effects of several relevant parameters of the system on the time-dependent force are also discussed. -- Highlights: •We get the dynamical CP force on a partially dressed atom in a dielectric cavity. •The force in this cavity is larger than that in infinite dielectric space. •The force is not symmetric with respect to the center of the cavity. •The oscillating time of the force increases with the cavity size.

  13. Dynamical Casimir–Polder force on a partially dressed atom in a cavity comprising a dielectric

    International Nuclear Information System (INIS)

    We put a two-level atom into a cavity comprising a dielectric with output coupling. An analytical expression of the dynamical Casimir–Polder force in such a system is obtained when the system starts from a partially dressed state. And the effects of several relevant parameters of the system on the time-dependent force are also discussed. -- Highlights: •We get the dynamical CP force on a partially dressed atom in a dielectric cavity. •The force in this cavity is larger than that in infinite dielectric space. •The force is not symmetric with respect to the center of the cavity. •The oscillating time of the force increases with the cavity size

  14. Minitips in Frequency-Modulation Atomic Force Microscopy at Liquid-Solid Interfaces

    Science.gov (United States)

    Hiasa, Takumi; Kimura, Kenjiro; Onishi, Hiroshi

    2012-02-01

    A frequency-modulation atomic force microscope was operated in liquid using sharpened and cone-shaped tips. The topography of mica and alkanethiol monolayers was obtained with subnanometer resolution, regardless of nominal tip radius, which was either 10 or 250 nm. Force-distance curves determined over a hexadecane-thiol interface showed force modulations caused by liquid layers structured at the interface. The amplitude of force modulation and the layer-to-layer distance were completely insensitive to the nominal tip radius. These results are evidence that minitips smaller than the nominal radius are present on the tip body and function as a force probe.

  15. Nano-rheology of hydrogels using direct drive force modulation atomic force microscopy†

    Science.gov (United States)

    Nalam, Prathima C.; Gosvami, Nitya N.; Caporizzo, Matthew A.; Composto, Russell J.

    2016-01-01

    We present a magnetic force-based direct drive modulation method to measure local nano-rheological properties of soft materials across a broad frequency range (10 Hz to 2 kHz) using colloid-attached atomic force microscope (AFM) probes in liquid. The direct drive method enables artefact-free measurements over several decades of excitation frequency, and avoids the need to evaluate medium-induced hydrodynamic drag effects. The method was applied to measure the local mechanical properties of polyacrylamide hydrogels. The frequency-dependent storage stiffness, loss stiffness, and loss tangent (tan δ) were quantified for hydrogels having high and low crosslinking densities by measuring the amplitude and the phase response of the cantilever while the colloid was in contact with the hydrogel. The frequency bandwidth was further expanded to lower effective frequencies (0.1 Hz to 10 Hz) by obtaining force–displacement (FD) curves. Slow FD measurements showed a recoverable but highly hysteretic response, with the contact mechanical behaviour dependent on the loading direction: approach curves showed Hertzian behaviour while retraction curves fit the JKR contact mechanics model well into the adhesive regime, after which multiple detachment instabilities occurred. Using small amplitude dynamic modulation to explore faster rates, the load dependence of the storage stiffness transitioned from Hertzian to a dynamic punch-type (constant contact area) model, indicating significant influence of material dissipation coupled with adhesion. Using the appropriate contact model across the full frequency range measured, the storage moduli were found to remain nearly constant until an increase began near ∼100 Hz. The softer gels' storage modulus increased from 7.9 ± 0.4 to 14.5 ± 2.1 kPa (∼85%), and the stiffer gels' storage modulus increased from 16.3 ± 1.1 to 31.7 ± 5.0 kPa (∼95%). This increase at high frequencies may be attributed to a contribution from solvent

  16. Dynamical Casimir-Polder force on a partially dressed atom near a conducting wall

    International Nuclear Information System (INIS)

    We study the time evolution of the Casimir-Polder force acting on a neutral atom in front of a perfectly conducting plate, when the system starts its unitary evolution from a partially dressed state. We solve the Heisenberg equations for both atomic and field quantum operators, exploiting a series expansion with respect to the electric charge and an iterative technique. After discussing the behavior of the time-dependent force on an initially partially dressed atom, we analyze a possible experimental scheme to prepare the partially dressed state and the observability of this new dynamical effect.

  17. Dynamical Casimir-Polder force on a partially dressed atom near a conducting wall

    CERN Document Server

    Messina, Riccardo; Passante, Roberto

    2010-01-01

    We study the time evolution of the Casimir-Polder force acting on a neutral atom in front of a perfectly conducting plate, when the system starts its unitary evolution from a partially dressed state. We solve the Heisenberg equations for both atomic and field quantum operators, exploiting a series expansion with respect to the electric charge and an iterative technique. After discussing the behaviour of the time-dependent force on an initially partially-dressed atom, we analyze a possible experimental scheme to prepare the partially dressed state and the observability of this new dynamical effect.

  18. Bacterial biofilms investigated by atomic force microscopy and electrochemistry

    DEFF Research Database (Denmark)

    Hu, Yifan

    Streptococcus mutans (dental caries). AFM was used to investigate the adhesion force on single live cell surfaces. Four different strains of Staphylococcus epidermidis in liquid aqueous environments were adressed. These strains were selected because of their special surface proteins related with the initial...... attachment on the surface. High-resolution AFM imaging showed no detectable differences among the four strains. Adhesion maps using hydrophobically modified tips compared with bare hydrophilic silicon nitride tips also showed small differences only. This indicates that hydrophobic effects are not the primary...... driving forces towards adhesion. Two chemical inhibitor compounds were found to have strong effects on the adhesion between the bare tips and the bacteria. Secondly, AFM and electrochemistry were combined to study bacterial biofilm formation on Au(111)-surfaces, to determine the surface charge and growth...

  19. Nonlinear Dynamics of Cantilever Tip-Sample Surface Interactions in Atomic Force Microscopy

    OpenAIRE

    Cantrell, John H.; Cantrell, Sean A.

    2010-01-01

    The various dynamical implementations of the atomic force microscope have become important nanoscale characterization tools for the development of novel materials and devices. One of the most significant factors affecting all dynamical AFM modalities is the cantilever tip-sample surface interaction force. We have developed a detailed mathematical model of this interaction that includes a quantitative consideration of the nonlinearity of the interaction force as a function of the cantilever ti...

  20. A study of interaction forces at the solid-liquid interface using atomic force microscopy

    OpenAIRE

    Liu, Fei

    2016-01-01

    Solid-liquid interfaces are not only omnipresent in our daily lives, but also in many applications in industry and technology. However, our fundamental understanding of the physical properties of these interfaces is far from complete. In this thesis, we study properties, such as solvation forces, DLVO forces and electro-hydrodynamic dissipation of solid-liquid interfaces by the use of AFM. Thereby, we study various methods of AFM force spectroscopy, to find reliable and efficient measurements...

  1. Computational model for noncontact atomic force microscopy: energy dissipation of cantilever.

    Science.gov (United States)

    Senda, Yasuhiro; Blomqvist, Janne; Nieminen, Risto M

    2016-09-21

    We propose a computational model for noncontact atomic force microscopy (AFM) in which the atomic force between the cantilever tip and the surface is calculated using a molecular dynamics method, and the macroscopic motion of the cantilever is modeled by an oscillating spring. The movement of atoms in the tip and surface is connected with the oscillating spring using a recently developed coupling method. In this computational model, the oscillation energy is dissipated, as observed in AFM experiments. We attribute this dissipation to the hysteresis and nonconservative properties of the interatomic force that acts between the atoms in the tip and sample surface. The dissipation rate strongly depends on the parameters used in the computational model. PMID:27420398

  2. Dispersion forces II. Many-body effects, excited atoms, finite temperature and quantum friction

    Energy Technology Data Exchange (ETDEWEB)

    Buhmann, Stefan Yoshi [Imperial College London (United Kingdom). Quantum Optics and Laser Science

    2012-07-01

    Presents the unified theory of dispersion forces. Gives a thorough overview over recent results of dispersion forces. Deals with applied macroscopic quantum electrodynamics. Gives guidance to simulation of realistic material properties. In this book, a modern unified theory of dispersion forces on atoms and bodies is presented which covers a broad range of advanced aspects and scenarios. Macroscopic quantum electrodynamics is shown to provide a powerful framework for dispersion forces which allows for discussing general properties like their non-additivity and the relation between microscopic and macroscopic interactions. It is demonstrated how the general results can be used to obtain dispersion forces on atoms in the presence of bodies of various shapes and materials. Starting with a brief recapitulation of volume I, this volume II deals especially with bodies of irregular shapes, universal scaling laws, dynamical forces on excited atoms, enhanced forces in cavity quantum electrodynamics, non-equilibrium forces in thermal environments and quantum friction. The book gives both the specialist and those new to the field a thorough overview over recent results in the field. It provides a toolbox for studying dispersion forces in various contexts.

  3. Atomic-resolution single-spin magnetic resonance detection concept based on tunneling force microscopy

    Science.gov (United States)

    Payne, A.; Ambal, K.; Boehme, C.; Williams, C. C.

    2015-05-01

    A study of a force detected single-spin magnetic resonance measurement concept with atomic spatial resolution is presented. The method is based upon electrostatic force detection of spin-selection rule controlled single-electron tunneling between two electrically isolated paramagnetic states. Single-spin magnetic resonance detection is possible by measuring the force detected tunneling charge noise on and off spin resonance. Simulation results of this charge noise, based upon physical models of the tunneling and spin physics, are directly compared to measured atomic force microscopy system noise. The results show that the approach could provide single-spin measurement of electrically isolated qubit states with atomic spatial resolution at room temperature.

  4. Concept for room temperature single-spin tunneling force microscopy with atomic spatial resolution

    Science.gov (United States)

    Payne, Adam

    A study of a force detected single-spin magnetic resonance measurement concept with atomic spatial resolution is presented. The method is based upon electrostatic force detection of spin-selection rule controlled single electron tunneling between two electrically isolated paramagnetic states. Single-spin magnetic resonance detection is possible by measuring the force detected tunneling charge noise on and off spin resonance. Simulation results of this charge noise, based upon physical models of the tunneling and spin physics, are directly compared to measured atomic force microscopy (AFM) system noise. The results show that the approach could provide single-spin measurement of electrically isolated defect states with atomic spatial resolution at room temperature.

  5. Recent experimental advances in precision Casimir force measurements with the atomic force microscope

    International Nuclear Information System (INIS)

    Advances in experimental methodology and analysis implemented in the precision measurement of the Casimir force with semiconductor surfaces are discussed. An experiment for the alteration of the Casimir force through a modification of the free carrier density in semiconductors is presented

  6. Recent experimental advances in precision Casimir force measurements with the atomic force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Chen, F; Mohideen, U [Department of Physics, University of California, Riverside, CA 92521 (United States)

    2006-05-26

    Advances in experimental methodology and analysis implemented in the precision measurement of the Casimir force with semiconductor surfaces are discussed. An experiment for the alteration of the Casimir force through a modification of the free carrier density in semiconductors is presented.

  7. Halo-like structures studied by atomic force microscopy

    DEFF Research Database (Denmark)

    Sørensen, Alexis Hammer; Kyhle, Anders; Hansen, L. Theil;

    1997-01-01

    Nanometer-sized clusters of copper have been produced in a hollow cathode sputtering source and deposited on SiOx. Halo-like structures consisting of micrometer sized protrusions in the solicon oxide surface surrounded by thin rings of smaller particles are observed. The area in between seems to ...... depleted of particles. We propose that the halo-like structures are a result of electrostatic forces acting between the incoming charged clusters and charged regions on the surface. A simple computer simulation supports this suggestion....

  8. Scanning probe – atomic force microscopy: new developments and applications

    International Nuclear Information System (INIS)

    Recent developments in scanning probe microscopy (SPM) have widened the spectrum of possible investigations that can be performed at a nanometric level at the surfaces of materials. They range, for instance, from physical properties such as surface potential and electric field topological determination to chemical, nanomechanical, catalytic and spectroscopic analysis in air in liquid or in a gaseous environment. After a brief introduction to new SPM technological developments, we present recent achievements in the characterisation and application of nanomorphology, electrostatic surface potential, dielectric properties, shear force microscopy and radiofrequency measurements, scanning microwave microscopy, nanomechanical properties mapping, frequency modulation SPM in air, liquid, vacuum, and finally high-speed SPM

  9. Atomic structure and surface defects at mineral-water interfaces probed by in situ atomic force microscopy

    Science.gov (United States)

    Siretanu, Igor; van den Ende, Dirk; Mugele, Frieder

    2016-04-01

    Atomic scale details of surface structure play a crucial role for solid-liquid interfaces. While macroscopic characterization techniques provide averaged information about bulk and interfaces, high resolution real space imaging reveals unique insights into the role of defects that are believed to dominate many aspects of surface chemistry and physics. Here, we use high resolution dynamic Atomic Force Microscopy (AFM) to visualize and characterize in ambient water the morphology and atomic scale structure of a variety of nanoparticles of common clay minerals adsorbed to flat solid surfaces. Atomically resolved images of the (001) basal planes are obtained on all materials investigated, namely gibbsite, kaolinite, illite, and Na-montmorillonite of both natural and synthetic origin. Next to regions of perfect crystallinity, we routinely observe extended regions of various types of defects on the surfaces, including vacancies of one or few atoms, vacancy islands, atomic steps, apparently disordered regions, as well as strongly adsorbed seemingly organic and inorganic species. While their exact nature is frequently difficult to identify, our observations clearly highlight the ubiquity of such defects and their relevance for the overall physical and chemical properties of clay nanoparticle-water interfaces.Atomic scale details of surface structure play a crucial role for solid-liquid interfaces. While macroscopic characterization techniques provide averaged information about bulk and interfaces, high resolution real space imaging reveals unique insights into the role of defects that are believed to dominate many aspects of surface chemistry and physics. Here, we use high resolution dynamic Atomic Force Microscopy (AFM) to visualize and characterize in ambient water the morphology and atomic scale structure of a variety of nanoparticles of common clay minerals adsorbed to flat solid surfaces. Atomically resolved images of the (001) basal planes are obtained on all

  10. Scanning-tunneling and atomic-force microscopy

    Science.gov (United States)

    (STM and AFM) are allowing for in situ (in air and under water) imaging of mineral surfaces at previously unattainable nanometer to atomic scales. The four images, which represent a range of STM/AFM applications, were all taken on [001] surfaces of hematite. Counterclockwise from bottom left, these micrographs are described as follows: (1) An STM image of oxygen sites on terraces separated by steps—imaged under oil at -300-mV sample bias. The difference in tunneling current between terrace (blue) and step-edge (pink) sites can be related to differences in local electronic structure that may affect the reactivity of the different sites Terraces step downward toward the lower left. A kink site is apparent along one step. (2) An AFM image in air showing the molecular-scale structure of the hematite surface.

  11. Measurement of the gold–gold bond rupture force at 4 K in a single-atom chain using photon-momentum-based force calibration

    International Nuclear Information System (INIS)

    We present instrumentation and methodology for simultaneously measuring force and displacement at the atomic scale at 4 K. The technique, which uses a macroscopic cantilever as a force sensor and high-resolution, high-stability fiber-optic interferometers for displacement measurement, is particularly well-suited to making accurate, traceable measurements of force and displacement in nanometer- and atomic-scale mechanical deformation experiments. The technique emphasizes accurate co-location of force and displacement measurement and measures cantilever stiffness at the contact point in situ at 4 K using photon momentum. We present preliminary results of measurements made of the force required to rupture a single atomic bond in a gold single-atom chain formed between a gold flat and a gold tip. Finally, we discuss the possible use of the gold–gold bond rupture force as an intrinsic force calibration value for forces near 1 nN. (paper)

  12. Casimir-Polder-like force on an atom outside a Schwarzschild black hole

    Energy Technology Data Exchange (ETDEWEB)

    Zhang Jialin [Institute of Physics and Key Laboratory of Low Dimensional Quantum Structures and Quantum Control of Ministry of Education, Hunan Normal University, Changsha, Hunan 410081 (China); Yu Hongwei [Institute of Physics and Key Laboratory of Low Dimensional Quantum Structures and Quantum Control of Ministry of Education, Hunan Normal University, Changsha, Hunan 410081 (China); Center for Nonlinear Science and Department of Physics, Ningbo University, Ningbo, Zhejiang 315211 (China)

    2011-10-15

    We calculate, in the framework of open quantum systems, the ground state energy-level shift for a static two-level atom outside a spherically symmetric black hole in interaction with fluctuating massless scalar fields in the Boulware and Unruh vacuums. We find that the energy-level shift is position dependent and thus gives rise to a force on the atom besides the classical gravitational force. For the case of the Boulware vacuum that represents a star which has not collapsed through its event horizon, this force is attractive near the horizon and is repulsive far away from the black hole with a behavior of r{sup -3}. For the case of the Unruh vacuum which represents a radiating black hole, we find that the contribution to the Casimir-Polder-like force due to the presence of Hawking radiation is always attractive and, remarkably, this attractive force diverges at the event horizon.

  13. Casimir-Polder like force on an atom outside a Schwarzschild black hole

    CERN Document Server

    Zhang, Jialin

    2011-01-01

    We calculate, in the framework of open quantum systems, the ground state energy level shift for a static two-level atom outside a spherically symmetric black hole in interaction with fluctuating massless scalar fields in the Boulware and Unruh vacuums. We find that the energy level shift is position dependent and it thus gives rise to a force on the atom besides the classical gravitational force. For the case of the Boulware vacuum which represents a star which has not collapsed through its event horizon, this force is attractive near the horizon, and is repulsive far away the black hole with a behavior of $r^{-3}$ . For the case of the Unruh vacuum which represents a radiating black hole, we find that the contribution to the Casimir-Polder like force due to the presence of the Hawking radiation is always attractive, and remarkably this attractive force diverges at the event horizon.

  14. The resistive switching in TiO2 films studied by conductive atomic force microscopy and Kelvin probe force microscopy

    Directory of Open Access Journals (Sweden)

    Yuanmin Du

    2013-08-01

    Full Text Available The resistive switching characteristics of TiO2 thin films were investigated using conductive atomic force microscopy (CAFM and Kelvin probe force microscopy (KPFM. The as-prepared TiO2 thin films were modulated into higher and lower resistance states by applying a local electric field. We showed that the resistive switching results from charge injection and release assisted by electro-migration of oxygen ions. An integrated model combined with filamentary and interfacial effects was utilized to elucidate the experimentally observed phenomenon.

  15. Surface potential investigation on single wall carbon nanotubes by Kelvin probe force microscopy and atomic force microscope potentiometry

    International Nuclear Information System (INIS)

    Surface potentials of single wall carbon nanotubes (SWNTs) connecting two metallic electrodes have been investigated by both Kelvin probe force microscopy (KFM) and atomic force microscope potentiometry (AFMP). By comparing the surface potential measurements obtained by both methods, we also studied the major factors affecting the potential measurements of the SWNTs, such as the surroundings, stray electric fields, and the effect of the AFM tip size, which can be larger than the SWNT diameter. In this study, we used KFM based on non-contact AFM and AFMP using the point-by-point contact mode in which the AFM tip worked as a voltage probe

  16. Detection of magnetic-labeled antibody specific recognition events by combined atomic force and magnetic force microscopy

    Science.gov (United States)

    Hong, Xia; Liu, Yanmei; Li, Jun; Guo, Wei; Bai, Yubai

    2009-09-01

    Atomic force (AFM) and magnetic force microscopy (MFM) were developed to detect biomolecular specific interaction. Goat anti-mouse immunoglobulin (anti-IgG) was covalently attached onto gold substrate modified by a self-assembly monolayer of thioctic acid via 1-ethyl-3-[3-(dimethylamino) propyl] carbodiimide (EDC) activation. Magnetic-labeled IgG then specifically adsorbed onto anti-IgG surface. The morphological variation was identified by AFM. MFM was proved to be a fine assistant tool to distinguish the immunorecognized nanocomposites from the impurities by detection of the magnetic signal from magnetic-labeled IgG. It would enhance the understanding of biomolecular recognition process.

  17. Detection of magnetic-labeled antibody specific recognition events by combined atomic force and magnetic force microscopy

    Energy Technology Data Exchange (ETDEWEB)

    Hong Xia [Center for Advanced Optoelectronic Functional Materials Research, Key Laboratory of UV Light-Emitting Materials and Technology, Ministry of Education, Northeast Normal University, Changchun 130024 (China); College of Chemistry, Jilin University, Changchun 130023 (China)], E-mail: xiahong@nenu.edu.cn; Liu Yanmei; Li Jun; Guo Wei; Bai Yubai [College of Chemistry, Jilin University, Changchun 130023 (China)

    2009-09-15

    Atomic force (AFM) and magnetic force microscopy (MFM) were developed to detect biomolecular specific interaction. Goat anti-mouse immunoglobulin (anti-IgG) was covalently attached onto gold substrate modified by a self-assembly monolayer of thioctic acid via 1-ethyl-3-[3-(dimethylamino) propyl] carbodiimide (EDC) activation. Magnetic-labeled IgG then specifically adsorbed onto anti-IgG surface. The morphological variation was identified by AFM. MFM was proved to be a fine assistant tool to distinguish the immunorecognized nanocomposites from the impurities by detection of the magnetic signal from magnetic-labeled IgG. It would enhance the understanding of biomolecular recognition process.

  18. Detection of magnetic-labeled antibody specific recognition events by combined atomic force and magnetic force microscopy

    International Nuclear Information System (INIS)

    Atomic force (AFM) and magnetic force microscopy (MFM) were developed to detect biomolecular specific interaction. Goat anti-mouse immunoglobulin (anti-IgG) was covalently attached onto gold substrate modified by a self-assembly monolayer of thioctic acid via 1-ethyl-3-[3-(dimethylamino) propyl] carbodiimide (EDC) activation. Magnetic-labeled IgG then specifically adsorbed onto anti-IgG surface. The morphological variation was identified by AFM. MFM was proved to be a fine assistant tool to distinguish the immunorecognized nanocomposites from the impurities by detection of the magnetic signal from magnetic-labeled IgG. It would enhance the understanding of biomolecular recognition process.

  19. Sharing my fifteen years experiences in the research field of Atomic Force Microscopy (AFM

    Directory of Open Access Journals (Sweden)

    Guha T

    2014-03-01

    Full Text Available Atomic Force Microscope (AFM was developed by Binnig and his coworkers in the year 1986. He was awarded Nobel Prize in physics for this work in 1986 in sharing with Rohrer and Ruska. Rationale to develop AFM: Scanning Tunneling Microscope (STM, the precursor to AFM is efficient in imaging electrically conducting specimen at atomic resolution. The impetus for development of AFM came to Binnig’s mind because of relatively poor efficiency of STM to image electrically non-conducting biological samples. He wondered why the surfaces be always imaged with a current but not with a force. He thought if small forces of interactions between a probe tip atoms and specimen surface atoms could be detected and amplified then imaging of biological specimen would be possible at a very high resolution. AFM working Principle: AFM is a Scanning Probe Microscopy (SPM by which imaging is realized by interaction of a probe with sample surface without any beam (light, electron and lens system. The probe is attached to a soft and sensitive cantilever and either specimen is scanned by probe or specimen scans itself under a stationary probe. Probe’s spring constant must be small and the deflection must be measurable along with high resonance frequency. The most commonly associated force with AFM is called Vander Waals force. Three modes of working are contact mode, non contact mode and tapping mode. In contact zone, the probe tip attached with cantilever is held less than a few A˚ from the sample surface and the inter-atomic force between the atoms of probe tip and sample surface is repulsive. In non-contact zone, the probe tip is held at a distance of 100s of A˚ from the sample surface and the inter-atomic force here is long range Vander Waals interaction and is attractive in nature. AFM is also called Scanning Force Microscope because the force of interaction between probe tip atoms and surface atoms is amplified to generate a signal voltage which modulates video

  20. Analysis of Atomic Force Curve Data for Mapping of Surface Properties in Water

    Science.gov (United States)

    Sirghi, Lucel; Nakagiri, Nobuyuki; Sugimura, Hiroyuki; Takai, Osamu

    2001-03-01

    This paper presents an analysis of atomic force versus distance curves for a silicon nitride probe and a silicon sample immersed in water. A custom-built atomic force microscope (AFM) was adapted for working in water by building a water cell from a liquid drop caught between a glass lamella fixed on the top of the cantilever base and the sample surface. An algorithm for processing of force curve data for long- and short-range forces is described. The force curve data taken for a sample consisting of a silicon wafer Si(111) patterned with V-shaped grooves and a silicon nitride cantilever in water were digitally acquired and automatically processed for mapping of surface properties. A weak repulsive double layer force with no relevant dependence on sample topography was observed on the force curves taken during approach movement of the cantilever. On the other hand, the attractive hydration force showed a strong dependence on the sample topography. Large hydration force values were noticed on the inclined faces of the V-shaped grooves while small hydration force values were noticed outside the grooves. The result was explained by the dependence of the tip curvature radius at the contact region on the tilt of the sample surface.

  1. Torsional spring constant obtained for an atomic force microscope cantilever

    Science.gov (United States)

    Jeon, Sangmin; Braiman, Yehuda; Thundat, Thomas

    2004-03-01

    In this letter, a method to measure the torsional spring constant of a microcantilever is described. The cantilever was twisted laterally without any normal load by inducing the Lorentz force. An electrical current was applied to the cantilever in a magnetic field, and the torsional resonance frequency of the cantilever was obtained. Based on the observation that the torsional resonance frequency is the same as the second resonance peak of the thermally vibrating cantilever, the ratio of deflection spring constant to torsional spring constant is easily obtained from a simple relationship. For the cantilever used here, the torsional spring constant is 11.24 N/m, 28 times greater than the deflection spring constant.

  2. Exploring the tip-sample interaction regimes in the presence of hysteretic forces in the tapping mode atomic force microscopy

    Science.gov (United States)

    Korayem, M. H.; Eghbal, M. M.; Ebrahimi, N.

    2011-07-01

    In this article, the tip-sample interaction regimes in the presence of hysteretic forces are investigated using atomic force microscopy in the tapping mode. For this purpose, two samples that cause the formation of hysteretic forces, namely, silicon (stiff sample) with an adsorbed water film and polyethylene (compliant sample), are used. Also, for deriving the equation of motion of the microcantilever, the continuous beam model is used, and for determining the contact forces, depending on the sample under investigation, the Derjaguin-Muller-Toporov and Johnson-Kendall-Roberts contact mechanics models are used. The results indicate that the hysteretic interaction forces generate high-periodic and irregular responses at certain tip-sample separation distances. In fact, at these distances, a family of steady-state attractors is found that can be observed in one branch on the minimum tip-sample separation curves and in two separate branches on the average force curves. The reason for this occurrence might be the alternate formation of a liquid column between the probe tip and the sample (in the presence of ambient moisture), and for the compliant sample, the reason might be the alternate formation of an adhesion neck. In this article, the role of hysteretic forces in producing the hysteresis of the amplitude-separation curves is also explored.

  3. A measurement of the hysteresis loop in force-spectroscopy curves using a tuning-fork atomic force microscope.

    Science.gov (United States)

    Lange, Manfred; van Vörden, Dennis; Möller, Rolf

    2012-01-01

    Measurements of the frequency shift versus distance in noncontact atomic force microscopy (NC-AFM) allow measurements of the force gradient between the oscillating tip and a surface (force-spectroscopy measurements). When nonconservative forces act between the tip apex and the surface the oscillation amplitude is damped. The dissipation is caused by bistabilities in the potential energy surface of the tip-sample system, and the process can be understood as a hysteresis of forces between approach and retraction of the tip. In this paper, we present the direct measurement of the whole hysteresis loop in force-spectroscopy curves at 77 K on the PTCDA/Ag/Si(111) √3 × √3 surface by means of a tuning-fork-based NC-AFM with an oscillation amplitude smaller than the distance range of the hysteresis loop. The hysteresis effect is caused by the making and breaking of a bond between PTCDA molecules on the surface and a PTCDA molecule at the tip. The corresponding energy loss was determined to be 0.57 eV by evaluation of the force-distance curves upon approach and retraction. Furthermore, a second dissipation process was identified through the damping of the oscillation while the molecule on the tip is in contact with the surface. This dissipation process occurs mainly during the retraction of the tip. It reaches a maximum value of about 0.22 eV/cycle. PMID:22496993

  4. Nano-scale mechanical probing of supported lipid bilayers with atomic force microscopy

    OpenAIRE

    Das, Chinmay; Sheik, Khizar H.; Olmsted, Peter D.; Connell, Simon D.

    2010-01-01

    We present theory and experiments for the force-distance curve $F(z_0)$ of an atomic force microscope (AFM) tip (radius $R$) indenting a supported fluid bilayer (thickness $2d$). For realistic conditions the force is dominated by the area compressibility modulus $\\kappa_A$ of the bilayer, and, to an excellent approximation, given by $F= \\pi \\kappa_A R z_0^2/(2d-z_0)^2$. The experimental AFM force curves from coexisting liquid ordered and liquid disordered domains in 3-component lipid bilayers...

  5. Microrheology of human lung epithelial cells measured by atomic force microscopy

    OpenAIRE

    Alcaraz, Jordi; Buscemi, Lara; Grabulosa, Mireia; Trepat, Xavier; Fabry, Ben; Farré, Ramon; Navajas, Daniel

    2003-01-01

    Lung epithelial cells are subjected to large cyclic forces from breathing. However, their response to dynamic stresses is poorly defined. We measured the complex shear modulus (G*(ω)) of human alveolar (A549) and bronchial (BEAS-2B) epithelial cells over three frequency decades (0.1–100 Hz) and at different loading forces (0.1–0.9 nN) with atomic force microscopy. G*(ω) was computed by correcting force-indentation oscillatory data for the tip-cell contact geometry and for the hydrodynamic vis...

  6. Probing Charges on the Atomic Scale by Means of Atomic Force Microscopy.

    Science.gov (United States)

    Albrecht, F; Repp, J; Fleischmann, M; Scheer, M; Ondráček, M; Jelínek, P

    2015-08-14

    Kelvin probe force spectroscopy was used to characterize the charge distribution of individual molecules with polar bonds. Whereas this technique represents the charge distribution with moderate resolution for large tip-molecule separations, it fails for short distances. Here, we introduce a novel local force spectroscopy technique which allows one to better disentangle electrostatic from other contributions in the force signal. It enables one to obtain charge-related maps at even closer tip-sample distances, where the lateral resolution is further enhanced. This enhanced resolution allows one to resolve contrast variations along individual polar bonds. PMID:26317733

  7. From Atoms to Animals: The Vital Force in Biology

    International Nuclear Information System (INIS)

    Perhaps the most significant event in intellectual history has occurred over the past several decades, a convergence of the sciences, a blurring of the distinctions between disciplines, from physics to chemistry to biology. Fundamental questions about human existence have been answered in chemical terms. What brings matter to life? What are our origins? What is the basis of cognitive activity? These and related questions have been a fertile area for philosophy and nonscientific analysis. The long history of such alternative approaches persists to this day. Life chemistry is explained by protein catalysts, in their simplest form known as enzymes, and in their full complexity, referred to as molecular machines. An example of great significance is the so-called transcription machinery, which reads out the genetic code, to direct the formation and function of all living things. The atomic structure of the transcription machinery was determined at Stanford, with the use of intense X-ray beams and facilities at the Stanford Synchrotron Radiation Laboratory at SLAC. The result is an image of this complex machinery in action, bringing genetic information to life.

  8. From Casimir-Polder Force to Dicke Physics: Interaction between Atoms and a Topological Insulator

    Science.gov (United States)

    Fuchs, Sebastian; Buhmann, Stefan

    We apply the theory of macroscopic quantum electrodynamics in dispersing and absorbing media to study the Casimir-Polder force between an atom and a topological insulator. The electromagnetic response of a topological insulator surface leads to a mixing of electric and magnetic fields, breaking the time-reversal symmetry. The coupling of these fields to an atom causes shifts of the atom's eigenenergies and modified decay rates near the surface of the topological insulator. Energy shifts and modified decay rates cannot only be triggered by the presence of a material, but can be caused by other atoms in close proximity as well. The collective dynamics of atoms (Dicke Physics) leads to a superradiant burst. Combining macroscopic QED and Dicke physics opens the door to the investigation of cooperative atom-surface interactions.

  9. Atomic structure and surface defects at mineral-water interfaces probed by in situ atomic force microscopy.

    Science.gov (United States)

    Siretanu, Igor; van den Ende, Dirk; Mugele, Frieder

    2016-04-14

    Atomic scale details of surface structure play a crucial role for solid-liquid interfaces. While macroscopic characterization techniques provide averaged information about bulk and interfaces, high resolution real space imaging reveals unique insights into the role of defects that are believed to dominate many aspects of surface chemistry and physics. Here, we use high resolution dynamic Atomic Force Microscopy (AFM) to visualize and characterize in ambient water the morphology and atomic scale structure of a variety of nanoparticles of common clay minerals adsorbed to flat solid surfaces. Atomically resolved images of the (001) basal planes are obtained on all materials investigated, namely gibbsite, kaolinite, illite, and Na-montmorillonite of both natural and synthetic origin. Next to regions of perfect crystallinity, we routinely observe extended regions of various types of defects on the surfaces, including vacancies of one or few atoms, vacancy islands, atomic steps, apparently disordered regions, as well as strongly adsorbed seemingly organic and inorganic species. While their exact nature is frequently difficult to identify, our observations clearly highlight the ubiquity of such defects and their relevance for the overall physical and chemical properties of clay nanoparticle-water interfaces. PMID:27030282

  10. Nonlinear Dynamics of Cantilever-Sample Interactions in Atomic Force Microscopy

    Science.gov (United States)

    Cantrell, John H.; Cantrell, Sean A.

    2010-01-01

    The interaction of the cantilever tip of an atomic force microscope (AFM) with the sample surface is obtained by treating the cantilever and sample as independent systems coupled by a nonlinear force acting between the cantilever tip and a volume element of the sample surface. The volume element is subjected to a restoring force from the remainder of the sample that provides dynamical equilibrium for the combined systems. The model accounts for the positions on the cantilever of the cantilever tip, laser probe, and excitation force (if any) via a basis set of set of orthogonal functions that may be generalized to account for arbitrary cantilever shapes. The basis set is extended to include nonlinear cantilever modes. The model leads to a pair of coupled nonlinear differential equations that are solved analytically using a matrix iteration procedure. The effects of oscillatory excitation forces applied either to the cantilever or to the sample surface (or to both) are obtained from the solution set and applied to the to the assessment of phase and amplitude signals generated by various acoustic-atomic force microscope (A-AFM) modalities. The influence of bistable cantilever modes of on AFM signal generation is discussed. The effects on the cantilever-sample surface dynamics of subsurface features embedded in the sample that are perturbed by surface-generated oscillatory excitation forces and carried to the cantilever via wave propagation are accounted by the Bolef-Miller propagating wave model. Expressions pertaining to signal generation and image contrast in A-AFM are obtained and applied to amplitude modulation (intermittent contact) atomic force microscopy and resonant difference-frequency atomic force ultrasonic microscopy (RDF-AFUM). The influence of phase accumulation in A-AFM on image contrast is discussed, as is the effect of hard contact and maximum nonlinearity regimes of A-AFM operation.

  11. Understanding the atomic-scale contrast in Kelvin Probe Force Microscopy

    CERN Document Server

    Nony, Laurent; Bocquet, Franck; Loppacher, Christian; 10.1103/PhysRevLett.103.036802

    2009-01-01

    A numerical analysis of the origin of the atomic-scale contrast in Kelvin probe force microscopy (KPFM) is presented. Atomistic simulations of the tip-sample interaction force field have been combined with a non-contact Atomic Force Microscope/KPFM simulator. The implementation mimics recent experimental results on the (001) surface of a bulk alkali halide crystal for which simultaneous atomic-scale topographical and Contact Potential Difference (CPD) contrasts were reported. The local CPD does reflect the periodicity of the ionic crystal, but not the magnitude of its Madelung surface potential. The imaging mechanism relies on the induced polarization of the ions at the tip-surface interface owing to the modulation of the applied bias voltage. Our findings are in excellent agreement with previous theoretical expectations and experimental observations.

  12. Plasmid DNA lesions induced by α particle exposure observed with the atomic force microscopy

    International Nuclear Information System (INIS)

    Objective: To examine the lesions of plasmid DNA induced by α particle exposure. Methods: The α-particle irradiated plasmid pGEM-Tl DNA was deposited on mica and was observed with Nanoscope III a atomic force microscopy. The irradiated DNA was concurrently analyzed by electrophoresis. Results: The three types of plasmid DNA molecules, i.e, open circle (OC), super coiled (SC) and linear were seen clearly under atomic force microscopy. The proportion of OC plasmid DNA was obviously increased at as less as 2 Gy of α particle exposure as compared with 10 Gy of γ-ray exposure. Conclusions: Clear image of plasmid DNA molecules was obtained using atomic force microscopy. The lesions of plasmid DNA induced by α particles were more serious than those by γ-ray with the same dose of exposure in vitro

  13. A simple model of molecular imaging with noncontact atomic force microscopy

    Science.gov (United States)

    Moll, Nikolaj; Gross, Leo; Mohn, Fabian; Curioni, Alessandro; Meyer, Gerhard

    2012-08-01

    Using functionalized tips, the atomic resolution of a single organic molecule can be achieved by noncontact atomic force microscopy (nc-AFM) operating in the regime of short-ranged repulsive Pauli forces. To theoretically describe the atomic contrast in such AFM images, we propose a simple model in which the Pauli repulsion is assumed to follow a power law as a function of the probed charge density. As the exponent in this power law is found to be largely independent of the sample molecule, our model provides a general method for simulating atomically resolved AFM images of organic molecules. For a single perylene-tetracarboxylic-dianhydride (PTCDA) molecule imaged with a CO-terminated tip, we find excellent agreement with the experimental data. Our model eliminates the need to take into account the full tip and sample system and therefore reduces computational cost by three orders of magnitude.

  14. A simple model of molecular imaging with noncontact atomic force microscopy

    International Nuclear Information System (INIS)

    Using functionalized tips, the atomic resolution of a single organic molecule can be achieved by noncontact atomic force microscopy (nc-AFM) operating in the regime of short-ranged repulsive Pauli forces. To theoretically describe the atomic contrast in such AFM images, we propose a simple model in which the Pauli repulsion is assumed to follow a power law as a function of the probed charge density. As the exponent in this power law is found to be largely independent of the sample molecule, our model provides a general method for simulating atomically resolved AFM images of organic molecules. For a single perylene-tetracarboxylic-dianhydride (PTCDA) molecule imaged with a CO-terminated tip, we find excellent agreement with the experimental data. Our model eliminates the need to take into account the full tip and sample system and therefore reduces computational cost by three orders of magnitude. (paper)

  15. A measurement of the hysteresis loop in force-spectroscopy curves using a tuning-fork atomic force microscope

    Directory of Open Access Journals (Sweden)

    Manfred Lange

    2012-03-01

    Full Text Available Measurements of the frequency shift versus distance in noncontact atomic force microscopy (NC-AFM allow measurements of the force gradient between the oscillating tip and a surface (force-spectroscopy measurements. When nonconservative forces act between the tip apex and the surface the oscillation amplitude is damped. The dissipation is caused by bistabilities in the potential energy surface of the tip–sample system, and the process can be understood as a hysteresis of forces between approach and retraction of the tip. In this paper, we present the direct measurement of the whole hysteresis loop in force-spectroscopy curves at 77 K on the PTCDA/Ag/Si(111 √3 × √3 surface by means of a tuning-fork-based NC-AFM with an oscillation amplitude smaller than the distance range of the hysteresis loop. The hysteresis effect is caused by the making and breaking of a bond between PTCDA molecules on the surface and a PTCDA molecule at the tip. The corresponding energy loss was determined to be 0.57 eV by evaluation of the force–distance curves upon approach and retraction. Furthermore, a second dissipation process was identified through the damping of the oscillation while the molecule on the tip is in contact with the surface. This dissipation process occurs mainly during the retraction of the tip. It reaches a maximum value of about 0.22 eV/cycle.

  16. Enhanced quality factors and force sensitivity by attaching magnetic beads to cantilevers for atomic force microscopy in liquid

    CERN Document Server

    Hoof, Sebastian; Hoogenboom, Bart W

    2012-01-01

    Dynamic-mode atomic force microscopy (AFM) in liquid remains complicated due to the strong viscous damping of the cantilever resonance. Here we show that a high-quality resonance (Q>20) can be achieved in aqueous solution by attaching a microgram-bead at the end of the nanogram-cantilever. The resulting increase in cantilever mass causes the resonance frequency to drop significantly. However, the force sensitivity --- as expressed via the minimum detectable force gradient --- is hardly affected, because of the enhanced quality factor. Via the enhancement of the quality factor, the attached bead also reduces the relative importance of noise in the deflection detector. It can thus yield an improved signal-to-noise ratio when this detector noise is significant. We describe and analyze these effects for a set-up which includes magnetic actuation of the cantilevers and which can be easily implemented in any AFM system that is compatible with an inverted optical microscope.

  17. Measuring anisotropic friction on WTe2 using atomic force microscopy in the force-distance and friction modes.

    Science.gov (United States)

    Watson, Gregory S; Myhra, Sverre; Watson, Jolanta A

    2010-04-01

    Layered materials which can be easily cleaved have proved to be excellent samples for the study of atomic scale friction. The layered transition metal dichalcogenides have been particularly popular. These materials exhibit a number of interesting properties ranging from superconductivity to low frictional coefficients. In this paper we have investigated the tribology of the dichalcogenide-WTe2. The coefficient of friction is less than 0.040 along the Te rows and increases to over 0.045 across the rows. The frictional forces almost doubled at normal loads of 5000 nN when scanning in the [010] direction in comparison to the [100] direction. The frictional responses of the AFM probe have been monitored in the frictional force and force-versus-distance (f-d) mode. A comparison between the outcomes using the two different modes demonstrates the factors which need to be considered for accurate measurements. PMID:20355449

  18. Enhanced atomic corrugation in dynamic force microscopy - The role of repulsive forces

    OpenAIRE

    Lichtenstein, L; Büchner, C.; Stuckenholz, S.; Heyde, M; Freund, H.

    2012-01-01

    Full range two dimensional (2D) force mapping was performed by means of low temperature dynamic force microscopy (DFM) on a highly complex surface structure. For this purpose, we used a thin film of vitreous silica on a Ru(0001)-support, which is a 2D structural equivalent to silica glass. The 2D spectroscopy shows that the contrast generating shift in vertical distance between two sites on the surface is twice as large on the repulsive branch of the frequency shift-distance curve as compared...

  19. Protein simulations combining an all-atom force field with a Go term

    International Nuclear Information System (INIS)

    Using a variant of parallel tempering, we study the changes in sampling within a simulation, when the all-atom model is coupled to a Go-like potential. We find that the native structure is not the lowest-energy configuration in the all-atom force field. Adding a Go term deforms the energy landscape in such a way that the native configuration becomes the global minimum but does not lead to faster thermalization

  20. Atomic scale imaging and spectroscopy of individual electron trap states using force detected dynamic tunnelling

    International Nuclear Information System (INIS)

    We report the first atomic scale imaging and spectroscopic measurements of electron trap states in completely non-conducting surfaces by dynamic tunnelling force microscopy/spectroscopy. Single electrons are dynamically shuttled to/from individual states in thick films of hafnium silicate and silicon dioxide. The new method opens up surfaces that are inaccessible to the scanning tunnelling microscope for imaging and spectroscopy on an atomic scale.

  1. High precision deflection measurement of microcantilever in an optical pickup head based atomic force microscopy

    Energy Technology Data Exchange (ETDEWEB)

    Lee, Sang Heon [Department of Mechanical Design Engineering, Andong National University, Andong 760-749 (Korea, Republic of)

    2012-11-15

    This paper presents the methodology to measure the precise deflection of microcantilever in an optical pickup head based atomic force microscopy. In this paper, three types of calibration methods have been proposed: full linearization, sectioned linearization, and the method based on astigmatism. In addition, the probe heads for easy calibration of optical pickup head and fast replacement of optical pickup head have been developed. The performances of each method have been compared through a set of experiments and constant height mode operation which was not possible in the optical pickup head based atomic force microscopy has been carried out successfully.

  2. Simulation of lipid bilayer self-assembly using all-atom lipid force fields.

    Science.gov (United States)

    Skjevik, Åge A; Madej, Benjamin D; Dickson, Callum J; Lin, Charles; Teigen, Knut; Walker, Ross C; Gould, Ian R

    2016-04-21

    In this manuscript we expand significantly on our earlier communication by investigating the bilayer self-assembly of eight different types of phospholipids in unbiased molecular dynamics (MD) simulations using three widely used all-atom lipid force fields. Irrespective of the underlying force field, the lipids are shown to spontaneously form stable lamellar bilayer structures within 1 microsecond, the majority of which display properties in satisfactory agreement with the experimental data. The lipids self-assemble via the same general mechanism, though at formation rates that differ both between lipid types, force fields and even repeats on the same lipid/force field combination. In addition to zwitterionic phosphatidylcholine (PC) and phosphatidylethanolamine (PE) lipids, anionic phosphatidylserine (PS) and phosphatidylglycerol (PG) lipids are represented. To our knowledge this is the first time bilayer self-assembly of phospholipids with negatively charged head groups is demonstrated in all-atom MD simulations. PMID:27034995

  3. Atomic force microscopy as a tool to evaluate the risk of cardiovascular diseases in patients

    Science.gov (United States)

    Guedes, Ana Filipa; Carvalho, Filomena A.; Malho, Inês; Lousada, Nuno; Sargento, Luís; Santos, Nuno C.

    2016-08-01

    The availability of biomarkers to evaluate the risk of cardiovascular diseases is limited. High fibrinogen levels have been identified as a relevant cardiovascular risk factor, but the biological mechanisms remain unclear. Increased aggregation of erythrocytes (red blood cells) has been linked to high plasma fibrinogen concentration. Here, we show, using atomic force microscopy, that the interaction between fibrinogen and erythrocytes is modified in chronic heart failure patients. Ischaemic patients showed increased fibrinogen–erythrocyte binding forces compared with non-ischaemic patients. Cell stiffness in both patient groups was also altered. A 12-month follow-up shows that patients with higher fibrinogen–erythrocyte binding forces initially were subsequently hospitalized more frequently. Our results show that atomic force microscopy can be a promising tool to identify patients with increased risk for cardiovascular diseases.

  4. A study of interaction forces at the solid-liquid interface using atomic force microscopy

    NARCIS (Netherlands)

    Liu, Fei

    2016-01-01

    Solid-liquid interfaces are not only omnipresent in our daily lives, but also in many applications in industry and technology. However, our fundamental understanding of the physical properties of these interfaces is far from complete. In this thesis, we study properties, such as solvation forces, DL

  5. Experimental procedures for precision measurements of the Casimir force with an atomic force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Chiu, H.-C.; Chang, C.-C.; Castillo-Garza, R; Chen, F; Mohideen, U [Department of Physics and Astronomy, University of California, Riverside, CA 92521 (United States)], E-mail: umar.mohideen@ucr.edu

    2008-04-25

    Experimental methods and procedures required for precision measurements of the Casimir force are presented. In particular, the best practices for obtaining stable cantilevers, calibration of the cantilever, correction of thermal and mechanical drift, measuring the contact separation, sphere radius and the roughness are discussed.

  6. Experimental procedures for precision measurements of the Casimir force with an atomic force microscope

    International Nuclear Information System (INIS)

    Experimental methods and procedures required for precision measurements of the Casimir force are presented. In particular, the best practices for obtaining stable cantilevers, calibration of the cantilever, correction of thermal and mechanical drift, measuring the contact separation, sphere radius and the roughness are discussed

  7. Multifunctional atomic force microscope cantilevers with Lorentz force actuation and self-heating capability

    International Nuclear Information System (INIS)

    This paper reports the development of microcantilevers capable of self-heating and Lorentz-force actuation, and demonstrates applications to thermal topography imaging. Electrical current passing through a U-shaped cantilever in the presence of a magnetic field induces a Lorentz force on the cantilever free end, resulting in cantilever actuation. This same current flowing through a resistive heater induces a controllable temperature increase. We present cantilevers designed for large actuation forces for a given cantilever temperature increase. We analyze the designs of two new cantilevers, along with a legacy cantilever design. The cantilevers are designed to have a spring constant of about 1.5 N m−1, a resonant frequency near 100 kHz, and self-heating capability with temperature controllable over the range 25–600 °C. Compared to previous reports on self-heating cantilevers, the Lorentz–thermal cantilevers generate up to seven times as much Lorentz force and two times as much oscillation amplitude. When used for thermal topography imaging, the Lorentz–thermal cantilevers can measure topography with a vertical resolution of 0.2 nm. (paper)

  8. Haptics and Graphic Analogies for the Understanding of Atomic Force Microscopy

    OpenAIRE

    Millet, Guillaume; LECUYER, Anatole; BURKHARDT, Jean Marie; Haliyo, Sinan; Regnier, Stéphane

    2013-01-01

    This paper aims to evaluate the benefits of using virtual reality and force-feedback to help teaching nanoscale applications. We propose a teaching aid that combines graphic analogies and haptics intended to improve the grasp of non-intuitive nanoscale phenomena for people without prior knowledge of nanophysics. We look specifically at the most important nanophysical phenomenon, namely, the behavior of the probe of an Atomic Force Microscope (AFM) as it approaches a sample. The results from e...

  9. A physical approach to reduce nonspecific adhesion in molecular recognition atomic force microscopy.

    OpenAIRE

    Willemsen, O H; Snel, M M; Kuipers, L.; Figdor, C.G.; De Greve, J; de Grooth, B G

    1999-01-01

    Atomic force microscopy is one of the few techniques that allow analysis of biological recognition processes at the single-molecule level. A major limitation of this approach is the nonspecific interaction between the force sensor and substrate. We have modeled the nonspecific interaction by looking at the interaction potential between a conical Si3N4 tip with a spherical end face and a mica surface in solution, using DLVO (Derjaguin, Landau, Verwey, Overbeek) theory and numerical calculation...

  10. Quantitative measurement of tip-sample interactions in amplitude modulation atomic force microscopy

    Science.gov (United States)

    Hölscher, H.

    2006-09-01

    The author introduces an algorithm for the reconstruction of the tip-sample interactions in amplitude modulation atomic force microscopy ("tapping mode"). The method is based on the recording of amplitude and phase versus distance curves and allows the reconstruction of tip-sample force and energy dissipation as a function of the actual tip-sample distance. The proposed algorithm is verified by a numerical simulation and applied to a silicon sample in ambient conditions.

  11. Biophysical measurements of cells, microtubules, and DNA with an atomic force microscope

    Science.gov (United States)

    Devenica, Luka M.; Contee, Clay; Cabrejo, Raysa; Kurek, Matthew; Deveney, Edward F.; Carter, Ashley R.

    2016-04-01

    Atomic force microscopes (AFMs) are ubiquitous in research laboratories and have recently been priced for use in teaching laboratories. Here, we review several AFM platforms and describe various biophysical experiments that could be done in the teaching laboratory using these instruments. In particular, we focus on experiments that image biological materials (cells, microtubules, and DNA) and quantify biophysical parameters including membrane tension, persistence length, contour length, and the drag force.

  12. QED Corrections to the Electromagnetic Abraham Force. Casimir Momentum of the Hydrogen atom?

    CERN Document Server

    Van Tiggelen, Bart; Rikken, Geert L J A

    2012-01-01

    We develop a QED approach to find the contribution of the quantum vacuum to the electromagnetic Abraham force. Semi-classical theories predict diverging contributions from the quantum vacuum. We show that the divergencies disappear by Kramers-Bethe mass-renormalization. The finite remainder is compared to the relativistic corrections to the Abraham force. This work generalizes an earlier paper [1], dedicated to the harmonic oscillator, to the hydrogen atom and corrects two subtle errors.

  13. Measuring the Elasticity of Clathrin-Coated Vesicles via Atomic Force Microscopy

    OpenAIRE

    Jin, Albert J.; Prasad, Kondury; Smith, Paul D.; Lafer, Eileen M.; Nossal, Ralph

    2006-01-01

    Using a new scheme based on atomic force microscopy (AFM), we investigate mechanical properties of clathrin-coated vesicles (CCVs). CCVs are multicomponent protein and lipid complexes of ∼100 nm diameter that are implicated in many essential cell-trafficking processes. Our AFM imaging resolves clathrin lattice polygons and provides height deformation in quantitative response to AFM-substrate compression force. We model CCVs as multilayered elastic spherical shells and, from AFM measurements, ...

  14. Measurement of the absolute separation for atomic force microscopy measurements in the presence of adsorbed polymer

    OpenAIRE

    McKee, C. T.; Mosse, W. K. J.; Ducker, W. A.

    2006-01-01

    We demonstrate that the absolute separation between an atomic force microscope (AFM) tip and a solid substrate can be measured in the presence of an irreversibly adsorbed polymer film. The separation is obtained from the analysis of a scattered evanescent wave that is generated at the surface of the solid. By comparing our scattering measurements to conventional AFM measurements, we also show an example where a conventional AFM measurement gives the incorrect force-distance profile. We valida...

  15. Average Dissipative and Dipole Forces on a Three-Level Atom in a Laguerre-Gaussian Beam

    Institute of Scientific and Technical Information of China (English)

    WANG Zheng-Ling; YIN Jian-Ping

    2005-01-01

    @@ By means of the optical Bloch equations based on the atomic density matrix elements, the general expressions of the average dissipative force, dipole force and the mechanical torque acting on a A-configuration three-level atom in a linearly-polarized Laguerre-Gaussian beam (LGB) with an angular momentum of lh are derived, and the general properties of the average dissipative and dipole force on the three-level atom in the linearly-polarized LGB are analysed. We find a resonant property (with two resonant peaks) of the dissipative force and a non-resonant property (with two pairs of non-resonant peaks) of the dipole force on the three-level atom, which are completely different from those on the two-level atom. Our study also shows that all of general expressions on the three-level atom will be simplified to those on the two-level atom in the approximation of large detuning.

  16. Atomic-Scale Variations of the Mechanical Response of 2D Materials Detected by Noncontact Atomic Force Microscopy

    Science.gov (United States)

    de la Torre, B.; Ellner, M.; Pou, P.; Nicoara, N.; Pérez, Rubén; Gómez-Rodríguez, J. M.

    2016-06-01

    We show that noncontact atomic force microscopy (AFM) is sensitive to the local stiffness in the atomic-scale limit on weakly coupled 2D materials, as graphene on metals. Our large amplitude AFM topography and dissipation images under ultrahigh vacuum and low temperature resolve the atomic and moiré patterns in graphene on Pt(111), despite its extremely low geometric corrugation. The imaging mechanisms are identified with a multiscale model based on density-functional theory calculations, where the energy cost of global and local deformations of graphene competes with short-range chemical and long-range van der Waals interactions. Atomic contrast is related with short-range tip-sample interactions, while the dissipation can be understood in terms of global deformations in the weakly coupled graphene layer. Remarkably, the observed moiré modulation is linked with the subtle variations of the local interplanar graphene-substrate interaction, opening a new route to explore the local mechanical properties of 2D materials at the atomic scale.

  17. Statistical Analysis of Long- and Short-Range Forces Involved in Bacterial Adhesion to Substratum Surfaces as Measured Using Atomic Force Microscopy ▿

    OpenAIRE

    CHEN, YUN; Henk J Busscher; van der Mei, Henny C.; Norde, Willem

    2011-01-01

    Surface thermodynamic analyses of microbial adhesion using measured contact angles on solid substrata and microbial cell surfaces are widely employed to determine the nature of the adhesion forces, i.e., the interplay between Lifshitz-van der Waals and acid-base forces. While surface thermodynamic analyses are often viewed critically, atomic force microscopy (AFM) can also provide information on the nature of the adhesion forces by means of Poisson analysis of the measured forces. This review...

  18. Exploring the electronic and mechanical properties of protein using conducting atomic force microscopy.

    Science.gov (United States)

    Zhao, Jianwei; Davis, Jason J; Sansom, Mark S P; Hung, Andrew

    2004-05-01

    In interfacing man-made electronic components with specifically folded biomacromolecules, the perturbative effects of junction structure on any signal generated should be considered. We report herein on the electron-transfer characteristics of the blue copper metalloprotein, azurin, as characterized at a refined level by conducting atomic force microscopy (C-AFM). Specifically, the modulation of current-voltage (I-V) behavior with compressional force has been examined. In the absence of assignable resonant electron tunneling within the confined bias region, from -1 to 1 V, the I-V behavior was analyzed with a modified Simmons formula. To interpret the variation of tunneling barrier height and barrier length obtained by fitting with the modified Simmons formula, an atom packing density model associated with protein mechanical deformation was proposed and simulated by molecular dynamics. The barrier heights determined at the minimum forces necessary for stable electrical contact correlate reasonably well with those estimated from bulk biophysical (electroanalytical and photochemical) experiments previously reported. At higher forces, the tunnel barrier decreases to fall within the range observed with saturated organic systems. Molecular dynamics simulations revealed changes in secondary structure and atomic density of the protein with respect to compression. At low compression, where transport measurements are made, secondary structure is retained, and atomic packing density is observed to increase linearly with force. These predictions, and those made at higher compression, are consistent with both experimentally observed modulations of tunneling barrier height with applied force and the applicability of the atom packing density model of electron tunneling in proteins to molecular-level analyses. PMID:15113232

  19. Development of novel and sensitive sensors based on microcantilever of atomic force microscope

    Institute of Scientific and Technical Information of China (English)

    JIN Yan; WANG Kemin; JIN Rong

    2006-01-01

    Recently, the development of sensors based on microfabricated cantilevers of atomic force microscope (AFM) has attracted considerable attention from the designers of novel physical, chemical, and biological sensors. Many kinds of sensors have been developed taking the advantages of its high-resolution imaging, force measurement and force sensitivity, such as immunosensor and DNA biosensor and the sensors for detection of intermolecular interaction. This paper reviews the progress made in this field and discusses the signal transfer principles by which the design of the sensors is achieved.

  20. Atomic Force Microscope Studies of the Fusion of Floating Lipid Bilayers

    OpenAIRE

    Abdulreda, Midhat H.; Moy, Vincent T.

    2007-01-01

    This study investigated the fusion of apposing floating bilayers of egg L-α-phosphatidylcholine (egg PC) or 1,2-dimyristoyl-sn-glycero-3-phosphocholine. Atomic force microscope measurements of fusion forces under different compression rates were acquired to reveal the energy landscape of the fusion process under varied lipid composition and temperature. Between compression rates of ∼1000 and ∼100,000 pN/s, applied forces in the range from ∼100 to ∼500 pN resulted in fusion of floating bilayer...

  1. Noncontact Atomic Force Microscopy: An Emerging Tool for Fundamental Catalysis Research.

    Science.gov (United States)

    Altman, Eric I; Baykara, Mehmet Z; Schwarz, Udo D

    2015-09-15

    Although atomic force microscopy (AFM) was rapidly adopted as a routine surface imaging apparatus after its introduction in 1986, it has not been widely used in catalysis research. The reason is that common AFM operating modes do not provide the atomic resolution required to follow catalytic processes; rather the more complex noncontact (NC) mode is needed. Thus, scanning tunneling microscopy has been the principal tool for atomic scale catalysis research. In this Account, recent developments in NC-AFM will be presented that offer significant advantages for gaining a complete atomic level view of catalysis. The main advantage of NC-AFM is that the image contrast is due to the very short-range chemical forces that are of interest in catalysis. This motivated our development of 3D-AFM, a method that yields quantitative atomic resolution images of the potential energy surfaces that govern how molecules approach, stick, diffuse, and rebound from surfaces. A variation of 3D-AFM allows the determination of forces required to push atoms and molecules on surfaces, from which diffusion barriers and variations in adsorption strength may be obtained. Pushing molecules towards each other provides access to intermolecular interaction between reaction partners. Following reaction, NC-AFM with CO-terminated tips yields textbook images of intramolecular structure that can be used to identify reaction intermediates and products. Because NC-AFM and STM contrast mechanisms are distinct, combining the two methods can produce unique insight. It is demonstrated for surface-oxidized Cu(100) that simultaneous 3D-AFM/STM yields resolution of both the Cu and O atoms. Moreover, atomic defects in the Cu sublattice lead to variations in the reactivity of the neighboring O atoms. It is shown that NC-AFM also allows a straightforward imaging of work function variations which has been used to identify defect charge states on catalytic surfaces and to map charge transfer within an individual

  2. Contribution to crystallographic slip assessment by means of topographic measurements achieved with atomic force microscopy

    International Nuclear Information System (INIS)

    In this paper, atomic force microscopy (AFM) is used to quantitatively characterize the plastic glide occurring during tensile deformation of a duplex 2205 stainless steel sample. We demonstrate that an appropriate treatment of the topographic image issued from AFM measurements allows precise and quantitative information about the characteristics of plastic deformation and especially the amount of crystallographic slip.

  3. Electrode coating by chemical mediator: The atomic force microscopy study of surface nanomorphology

    Czech Academy of Sciences Publication Activity Database

    Mansfeldová, Věra; Janda, Pavel; Tarábková, Hana

    Ústí nad Labem: BEST servis, 2010 - (Navrátil, T.; Barek, J.), s. 80-84 ISBN 978-80-254-6710-7. [Modern Electroanalytical Methods /30./. Jetřichovice (CZ), 24.05.2010-28.05.2010] Institutional research plan: CEZ:AV0Z40400503 Keywords : atomic force microscopy * carbon electrode * surface modification Subject RIV: CG - Electrochemistry

  4. Atomic force microscope with combined FTIR-Raman spectroscopy having a micro thermal analyzer

    Science.gov (United States)

    Fink, Samuel D.; Fondeur, Fernando F.

    2011-10-18

    An atomic force microscope is provided that includes a micro thermal analyzer with a tip. The micro thermal analyzer is configured for obtaining topographical data from a sample. A raman spectrometer is included and is configured for use in obtaining chemical data from the sample.

  5. Characterization of novel sufraces by FTIR spectroscopy and atomic force microscopy for food pathogen detection

    Science.gov (United States)

    Single molecular detection of pathogens and toxins of interest to food safety is within grasp using technology such as Atomic Force Microscopy. Using antibodies or specific aptamers connected to the AFM tip make it possible to detect a pathogen molecule on a surface. However, it also becomes necess...

  6. Polymerized LB films imaged with a combined atomic force microscope-fluorescence microscope

    NARCIS (Netherlands)

    Putman, Constant A.J.; Hansma, Helen G.; Gaub, Hermann E.; Hansma, Paul K.

    1992-01-01

    The first results obtained with a new stand-alone atomic force microscope (AFM) integrated with a standard Zeiss optical fluorescence microscope are presented. The optical microscope allows location and selection of objects to be imaged with the high-resolution AFM. Furthermore, the combined microsc

  7. Magni: A Python Package for Compressive Sampling and Reconstruction of Atomic Force Microscopy Images

    DEFF Research Database (Denmark)

    Oxvig, Christian Schou; Pedersen, Patrick Steffen; Arildsen, Thomas;

    2014-01-01

    Magni is an open source Python package that embraces compressed sensing and Atomic Force Microscopy (AFM) imaging techniques. It provides AFM-specific functionality for undersampling and reconstructing images from AFM equipment and thereby accelerating the acquisition of AFM images. Magni also pr...... convenient platform for researchers in compressed sensing aiming at obtaining a high degree of reproducibility of their research....

  8. A Computer-Controlled Classroom Model of an Atomic Force Microscope

    Science.gov (United States)

    Engstrom, Tyler A.; Johnson, Matthew M.; Eklund, Peter C.; Russin, Timothy J.

    2015-01-01

    The concept of "seeing by feeling" as a way to circumvent limitations on sight is universal on the macroscopic scale--reading Braille, feeling one's way around a dark room, etc. The development of the atomic force microscope (AFM) in 1986 extended this concept to imaging in the nanoscale. While there are classroom demonstrations that use…

  9. Atomic Force Microscopy of Novel Zeolitic Materials Prepared by Top-Down Synthesis and ADOR Mechanism

    Czech Academy of Sciences Publication Activity Database

    Smith, R. L.; Eliášová, Pavla; Mazur, Michal; Attfield, M. P.; Čejka, Jiří; Anderson, M. W.

    2014-01-01

    Roč. 20, č. 33 (2014), s. 10446-10450. ISSN 0947-6539 R&D Projects: GA ČR GBP106/12/G015 Institutional support: RVO:61388955 Keywords : assembly * atomic force microscopy * top-down synthesis Subject RIV: CF - Physical ; Theoretical Chemistry Impact factor: 5.731, year: 2014

  10. Probing the compressibility of tumor cell nuclei by combined atomic force-confocal microscopy

    NARCIS (Netherlands)

    Krause, M.; Riet, J. te; Wolf, K. van der

    2013-01-01

    The cell nucleus is the largest and stiffest organelle rendering it the limiting compartment during migration of invasive tumor cells through dense connective tissue. We here describe a combined atomic force microscopy (AFM)-confocal microscopy approach for measurement of bulk nuclear stiffness toge

  11. Nano Goes to School: A Teaching Model of the Atomic Force Microscope

    Science.gov (United States)

    Planinsic, Gorazd; Kovac, Janez

    2008-01-01

    The paper describes a teaching model of the atomic force microscope (AFM), which proved to be successful in the role of an introduction to nanoscience in high school. The model can demonstrate the two modes of operation of the AFM (contact mode and oscillating mode) as well as some basic principles that limit the resolution of the method. It can…

  12. An atomic force microscopy study of the interactions between indolicidin and supported planar bilayers

    DEFF Research Database (Denmark)

    Askou, Hans Jakob; Jakobsen, Rasmus Neergaard; Fojan, Peter

    2008-01-01

    Indolicidin, a tryptophane-rich antimicrobial peptide , was used to investigate the interactions with a zwitterionic phosphatidylcholine as a model membrane system. In situ atomic force microscopy in liquid medium and phosphatidylcholine supported planar bilayers enabled the study of the interact...

  13. Sample Preparation and Imaging of Single Adenovirus Particle Using Atomic Force Microscopy in Liquid

    NARCIS (Netherlands)

    Liang, Yan; Li Chen, [Unknown; van Rosmalen, Mariska G M; Wuite, Gijs J L; Roos, Wouter H

    2015-01-01

    Atomic force microscopy (AFM), as a sophisticated imaging tool with nanoscale resolution, is widely used in virus research and the application of functional viral particles. To investigate single viruses by AFM in a physiologically relevant environment (liquid), an appropriate surface treatment to p

  14. Presentation to the Atomic Energy Commission and the Air Force, June 14, 1962

    Energy Technology Data Exchange (ETDEWEB)

    none

    1962-10-01

    This volume contains the charts and backup material presented to the Atomic Energy Commission and Air Force on June 14, 1962 concerning General Electric's Nuclear Materials and Propulsion Operation (formerly the Aircraft Nuclear Propulsion Department), during its work on the development of a nuclear power plant for manned aircraft.

  15. Nanoparticle sizing: a comparative study using atomic force microscopy, transmission electron microscopy, and ferromagnetic resonance

    International Nuclear Information System (INIS)

    Atomic force microscopy (AFM), transmission electron microscopy (TEM), and ferromagnetic resonance (FMR) were used to unfold the nanoparticle size of a ferrofluid sample. Compared to TEM, the AFM method showed a nanoparticle diameter (Dm) reduction of 20% and standard deviation (σ) increase of 15%. The differences in Dm and σ were associated with the AFM tip and the nanoparticle concentration on the substrate

  16. Use of atomic force microscopy to quantify slip irreversibility in a nickel-base superalloy

    Energy Technology Data Exchange (ETDEWEB)

    Risbet, M.; Feaugas, X.; Guillemer-Neel, C.; Clavel, M

    2003-09-15

    Atomic force microscopy was used to study the evolution of surface deformation during cyclic loading in a nickel-base superalloy. Cyclic slip irreversibility has been investigated using quantitative evaluation of extrusion heights and inter-band spacing. This approach is applied to formulate a microscopic crack initiation law, compared to a classical Manson-Coffin relationship.

  17. Use of atomic force microscopy to quantify slip irreversibility in a nickel-base superalloy

    International Nuclear Information System (INIS)

    Atomic force microscopy was used to study the evolution of surface deformation during cyclic loading in a nickel-base superalloy. Cyclic slip irreversibility has been investigated using quantitative evaluation of extrusion heights and inter-band spacing. This approach is applied to formulate a microscopic crack initiation law, compared to a classical Manson-Coffin relationship

  18. Atomic Radii in Molecules for Use in a Polarizable Force Field

    NARCIS (Netherlands)

    Swart, Marcel; Van Duijnen, Piet Th

    2011-01-01

    We report here the results for an ab initio approach to obtain the parameters needed for molecular simulations using a polarizable force field. These parameters consist of the atomic charges, polarizabilities, and radii. The former two are readily obtained using methods reported previously (van Duij

  19. Surface topography characterization using an atomic force microscope mounted on a coordinate measuring machine

    DEFF Research Database (Denmark)

    De Chiffre, Leonardo; Hansen, H.N; Kofod, N

    1999-01-01

    The paper describes the construction, testing and use of an integrated system for topographic characterization of fine surfaces on parts having relatively big dimensions. An atomic force microscope (AFM) was mounted on a manual three-coordinate measuring machine (CMM) achieving free positioning o...

  20. Hierarchical Networks of Casein Proteins: An Elasticity Study Based on Atomic Force Microscopy

    NARCIS (Netherlands)

    Uricanu, V.I.; Duits, M.H.G.; Mellema, J.

    2004-01-01

    2D- and 3D-atomic force microscopy (AFM) experiments were performed on single casein micelles (CM) in native state, submerged in liquid, using a home-built AFM instrument. The micelles were immobilized via carbodiimide chemistry to a self-assembled monolayer supported on gold-coated slides. Off-line

  1. Atomic force microscopy as a powerful tool of surface nano- and microscale characterization

    Czech Academy of Sciences Publication Activity Database

    Špírková, Milena

    Herceg Novi: Materials Research Society of Serbia , 2013. s. 13. [Annual Conference YUCOMAT 2013 /15./. 02.09.2013-06.09.2013, Herceg Novi] R&D Projects: GA AV ČR(CZ) IAAX08240901 Institutional support: RVO:61389013 Keywords : atomic force microscopy * surface analysis * organic - inorganic nanocomposite Subject RIV: JI - Composite Materials

  2. Metrological investigation of nanostructured polymer surfaces replication using atomic force microscopy

    DEFF Research Database (Denmark)

    Quagliotti, D.; Tosello, G.; Hansen, H. N.

    Polymer specimens have been manufactured by injection moulding and measured by atomic force microscopy (AFM) with the aim to investigate the possibility of replicating their surfaces with good fidelity at the sub-μm dimensional scale. Three different cases with surface features in the 100 nm ampl...

  3. Interaction potential and repulsive force between atoms whose internuclear separations are small

    International Nuclear Information System (INIS)

    The Thomas-Fermi equation is solved for the homonuclear diatomic molecule. The electronic density and electrostatic potential at each point are used to calculate energies and interaction potentials for very small internuclear separation distances. The repulsive force between atoms is derived by means of the virial theorem. (author)

  4. Automation of the CHARMM General Force Field (CGenFF) II: Assignment of bonded parameters and partial atomic charges

    OpenAIRE

    Vanommeslaeghe, K.; Raman, E. Prabhu; MacKerell, A.D.

    2012-01-01

    Molecular mechanics force fields are widely used in computer-aided drug design for the study of drug candidates interacting with biological systems. In these simulations, the biological part is typically represented by a specialized biomolecular force field, while the drug is represented by a matching general (organic) force field. In order to apply these general force fields to an arbitrary drug-like molecule, functionality for assignment of atom types, parameters and partial atomic charges ...

  5. Intermittent contact interaction between an atomic force microscope cantilever and a nanowire

    Science.gov (United States)

    Knittel, I.; Ungewitter, L.; Hartmann, U.

    2012-05-01

    We investigate in theory and experiment the intermittent contact interaction between an atomic force microscope (AFM) cantilever and a nanowire under ambient conditions. The nanowire is modeled as a spring reacting instantaneously to any change of the force between the wire and the cantilever. This implies that the cantilever is subject to an "effective" force-distance relation, containing not only the surface forces but also the deflection of the nanowire. Experimentally, CVD-grown tin oxide nanowires and lithographically structured silicon nanowire arrays were investigated by intermittent contact AFM. By comparison of experimental and simulated distance-dependent resonance curves it is found that the nanowires behave like "fast nanosprings" and that the adhesion force is one of the key factors determining distance-dependent resonance curves. The results are fully applicable to a scenario in which a cantilever equipped by a nanowire interacts with a surface.

  6. The mapping of yeast's G-protein coupled receptor with an atomic force microscope

    Science.gov (United States)

    Takenaka, Musashi; Miyachi, Yusuke; Ishii, Jun; Ogino, Chiaki; Kondo, Akihiko

    2015-03-01

    An atomic force microscope (AFM) can measure the adhesion force between a sample and a cantilever while simultaneously applying a rupture force during the imaging of a sample. An AFM should be useful in targeting specific proteins on a cell surface. The present study proposes the use of an AFM to measure the adhesion force between targeting receptors and their ligands, and to map the targeting receptors. In this study, Ste2p, one of the G protein-coupled receptors (GPCRs), was chosen as the target receptor. The specific force between Ste2p on a yeast cell surface and a cantilever modified with its ligand, α-factor, was measured and found to be approximately 250 pN. In addition, through continuous measuring of the cell surface, a mapping of the receptors on the cell surface could be performed, which indicated the differences in the Ste2p expression levels. Therefore, the proposed AFM system is accurate for cell diagnosis.

  7. Probing intra-molecular mechanics of single circularly permuted green fluorescent protein with atomic force microscopy

    International Nuclear Information System (INIS)

    We investigated the mechanical unfolding of single circularly permuted green fluorescent protein (cpGFP) with atomic force microscopy (AFM). The molecule was stretched from its N- and C-termini by an external force causing an elongation of the polypeptide chain up to its full length. The features of the force-extension (F-E) curves were found to depend on the stretching speed. At fast speeds, we detected one peak in the F-E curves before final rupture of the extended molecule, which we interpreted as the unfolding of two terminal halves within cpGFP. We observed several more force peaks in a sawtooth pattern at much slower speeds, and explained the appearance of such force peaks as cooperative unfolding of the hidden sub-structures inside each terminal half

  8. Fluctuation-induced forces between atoms and surfaces: the Casimir-Polder interaction

    CERN Document Server

    Intravaia, F; Antezza, M

    2010-01-01

    Electromagnetic fluctuation-induced forces between atoms and surfaces are generally known as Casimir-Polder interactions. The exact knowledge of these forces is rapidly becoming important in modern experimental set-ups and for technological applications. Recent theoretical and experimental investigations have shown that such an interaction is tunable in strength and sign, opening new perspectives to investigate aspects of quantum field theory and condensed-matter physics. In this Chapter we review the theory of fluctuation-induced interactions between atoms and a surface, paying particular attention to the physical characterization of the system. We also survey some recent developments concerning the role of temperature, situations out of thermal equilibrium, and measurements involving ultra-cold atoms.

  9. Multiparametric atomic force microscopy imaging of single bacteriophages extruding from living bacteria.

    Science.gov (United States)

    Alsteens, David; Trabelsi, Heykel; Soumillion, Patrice; Dufrêne, Yves F

    2013-01-01

    Force-distance (FD) curve-based atomic force microscopy is a valuable tool to simultaneously image the structure and map the biophysical properties of biological samples at the nanoscale. Traditionally, FD-based atomic force microscopy has been severely limited by its poor temporal and lateral resolutions. Here we report the use of advanced FD-based technology combined with biochemically sensitive tips to image filamentous bacteriophages extruding from living bacteria at unprecedented speed and resolution. Directly correlated multiparametric images of the structure, adhesion and elasticity of infected bacteria demonstrate that the sites of assembly and extrusion localize at the bacterial septum in the form of soft nanodomains surrounded by stiff cell wall material. The quantitative nano-bio-imaging method presented here offers a wealth of opportunities for mapping the physical properties and molecular interactions of complex biosystems, from viruses to tissues. PMID:24336094

  10. Surface features on Sahara soil dust particles made visible by atomic force microscope (AFM phase images

    Directory of Open Access Journals (Sweden)

    M. O. Andreae

    2008-10-01

    Full Text Available We show that atomic force microscopy (AFM phase images can reveal surface features of soil dust particles, which are not evident using other microscopic methods. The non-contact AFM method is able to resolve topographical structures in the nanometer range as well as to uncover repulsive atomic forces and attractive van der Waals' forces, and thus gives insight to surface properties. Though the method does not allow quantitative assignment in terms of chemical compound description, it clearly shows deposits of distinguishable material on the surface. We apply this technique to dust aerosol particles from the Sahara collected over the Atlantic Ocean and describe micro-features on the surfaces of such particles.

  11. Surface features on Sahara soil dust particles made visible by atomic force microscope (AFM phase images

    Directory of Open Access Journals (Sweden)

    G. Helas

    2008-08-01

    Full Text Available We show that atomic force microscopy (AFM phase images can reveal surface features of soil dust particles, which are not evident using other microscopic methods. The non-contact AFM method is able to resolve topographical structures in the nanometer range as well as to uncover repulsive atomic forces and attractive van der Waals' forces, and thus gives insight to surface properties. Though the method does not allow quantitative assignment in terms of chemical compound description, it clearly shows deposits of distinguishable material on the surface. We apply this technique to dust aerosol particles from the Sahara collected over the Atlantic Ocean and describe micro-features on the surfaces of such particles.

  12. Amplitude modulation atomic force microscopy, is acoustic driving in liquid quantitatively reliable?

    Science.gov (United States)

    Liu, Fei; Zhao, Cunlu; Mugele, Frieder; van den Ende, Dirk

    2015-09-25

    Measuring quantitative tip-sample interaction forces in dynamic atomic force microscopy in fluids is challenging because of the strong damping of the ambient viscous medium and the fluid-mediated driving forces. This holds in particular for the commonly used acoustic excitation of the cantilever oscillation. Here we present measurements of tip-sample interactions due to conservative DLVO and hydration forces and viscous dissipation forces in aqueous electrolytes using tips with radii varying from typical 20 nm for the DLVO and hydration forces, to 1 μm for the viscous dissipation. The measurements are analyzed using a simple harmonic oscillator model, continuous beam theory with fluid-mediated excitation and thermal noise spectroscopy (TNS). In all cases consistent conservative forces, deviating less than 40% from each other, are obtained for all three approaches. The DLVO forces are even within 5% of the theoretical expectations for all approaches. Accurate measurements of dissipative forces within 15% of the predictions of macroscopic fluid dynamics require the use of TNS or continuous beam theory including fluid-mediated driving. Taking this into account, acoustic driving in liquid is quantitatively reliable. PMID:26335613

  13. Force field analysis suggests a lowering of diffusion barriers in atomic manipulation due to presence of STM tip.

    Science.gov (United States)

    Emmrich, Matthias; Schneiderbauer, Maximilian; Huber, Ferdinand; Weymouth, Alfred J; Okabayashi, Norio; Giessibl, Franz J

    2015-04-10

    We study the physics of atomic manipulation of CO on a Cu(111) surface by combined scanning tunneling microscopy and atomic force microscopy at liquid helium temperatures. In atomic manipulation, an adsorbed atom or molecule is arranged on the surface using the interaction of the adsorbate with substrate and tip. While previous experiments are consistent with a linear superposition model of tip and substrate forces, we find that the force threshold depends on the force field of the tip. Here, we use carbon monoxide front atom identification (COFI) to characterize the tip's force field. Tips that show COFI profiles with an attractive center can manipulate CO in any direction while tips with a repulsive center can only manipulate in certain directions. The force thresholds are independent of bias voltage in a range from 1 to 10 mV and independent of temperature in a range of 4.5 to 7.5 K. PMID:25910137

  14. Atomically resolved surface structures of vapor deposited amorphous silicon-carbon alloys: An atomic force microscopy and spectroscopic study

    International Nuclear Information System (INIS)

    Silicon carbide alloys are widely used in high-tech applications due to their interesting combination of chemical, mechanical and electronic properties. Growing thin films of this material in a simple and controlled way is a hot topic in modern material's science. In particular, the possibility to tailor the film properties just by tuning the deposition temperature would be an important progress. In the present work amorphous silicon-carbon alloys thin films have been deposited by electron beam sublimation of a poly-crystalline silicon carbide target in vacuum environment. The deposition temperature was varied from Room Temperature to about 1300 K. The resulting films were analyzed by means of Ultra High Vacuum-Atomic Force Microscopy (UHV-AFM) down to even atomic resolution. The observed features agree with literature data, e.g. interatomic bond lengths, as achieved by others methods, and the structural arrangements of silicon and carbon atoms as concluded from IR and Raman spectroscopy measurements carried out on the same samples. The results not only allow a correlation between film properties and deposition temperature but also support the notion of the UHV-AFM images of the amorphous surfaces being atomically resolved.

  15. Temperature and force dependence of electron transport via the copper protein azurin: conductive probe atomic force microscopy measurements

    CERN Document Server

    Li, Wenjie; Amdursky, Nadav; Cohen, Sidney R; Pecht, Israel; Sheves, Mordechai; Cahen, David

    2012-01-01

    We report conducting probe atomic force microscopy (CP-AFM) measurements of electron transport (ETp), as a function of temperature and force, through monolayers of holo-azurin (holo-Az) and Cu-depleted Az (apo-Az) that retain only their tightly bound water, immobilized on gold surfaces. The changes in CP-AFM current-voltage (I-V) curves for holo-Az and apo-Az, measured between 250 - 370K, are strikingly different. While ETp across holo-Az at low force (6 nN) is temperature-independent over the whole examined range, ETp across apo-Az is thermally activated, with calculated activation energy of 600\\pm100 meV. These results confirm our results of macroscopic contact area ETp measurements via holo- and apo-Az, as a function of temperature, where the crucial role of the Cu redox centre has been observed. While increasing the applied tip force from 6 to 12 nN did not significantly change the temperature dependence of ETp via apo-Az, ETp via holo-Az changed qualitatively, namely from temperature-independent at 6 nN ...

  16. Towards 3D charge localization by a method derived from atomic force microscopy: the electrostatic force distance curve

    Science.gov (United States)

    Villeneuve-Faure, C.; Boudou, L.; Makasheva, K.; Teyssedre, G.

    2014-11-01

    Charges injection and accumulation in the dielectric remains a critical issue, mainly because these phenomena are involved in a great number of failure mechanisms in cables or electronic components. Achieving a better understanding of the mechanisms leading to charge injection, transport and trapping under electrical stress and of the relevant interface phenomena is a high priority. The classical methods used for space charge density profile measurements have a limited spatial resolution, which prevents them being used for investigating thin dielectric layers or interface processes. Thus, techniques derived from atomic force microscopy (AFM) have been investigated more and more for this kind of application, but so far they have been limited by their lack of in-depth sensitivity. In this paper a new method for space charge probing is described, the electrostatic force distance curve (EFDC), which is based on electrostatic force measurements using AFM. A comparison with the results obtained using kelvin force microscopy (KFM) allowed us to highlight the fact that EFDC is sensitive to charges localized in the third-dimension.

  17. An optimized intermolecular force field for hydrogen-bonded organic molecular crystals using atomic multipole electrostatics

    Science.gov (United States)

    Pyzer-Knapp, Edward O.; Thompson, Hugh P. G.; Day, Graeme M.

    2016-01-01

    We present a re-parameterization of a popular intermolecular force field for describing intermolecular interactions in the organic solid state. Specifically we optimize the performance of the exp-6 force field when used in conjunction with atomic multipole electrostatics. We also parameterize force fields that are optimized for use with multipoles derived from polarized molecular electron densities, to account for induction effects in molecular crystals. Parameterization is performed against a set of 186 experimentally determined, low-temperature crystal structures and 53 measured sublimation enthalpies of hydrogen-bonding organic molecules. The resulting force fields are tested on a validation set of 129 crystal structures and show improved reproduction of the structures and lattice energies of a range of organic molecular crystals compared with the original force field with atomic partial charge electrostatics. Unit-cell dimensions of the validation set are typically reproduced to within 3% with the re-parameterized force fields. Lattice energies, which were all included during parameterization, are systematically underestimated when compared with measured sublimation enthalpies, with mean absolute errors of between 7.4 and 9.0%. PMID:27484370

  18. An optimized intermolecular force field for hydrogen-bonded organic molecular crystals using atomic multipole electrostatics.

    Science.gov (United States)

    Pyzer-Knapp, Edward O; Thompson, Hugh P G; Day, Graeme M

    2016-08-01

    We present a re-parameterization of a popular intermolecular force field for describing intermolecular interactions in the organic solid state. Specifically we optimize the performance of the exp-6 force field when used in conjunction with atomic multipole electrostatics. We also parameterize force fields that are optimized for use with multipoles derived from polarized molecular electron densities, to account for induction effects in molecular crystals. Parameterization is performed against a set of 186 experimentally determined, low-temperature crystal structures and 53 measured sublimation enthalpies of hydrogen-bonding organic molecules. The resulting force fields are tested on a validation set of 129 crystal structures and show improved reproduction of the structures and lattice energies of a range of organic molecular crystals compared with the original force field with atomic partial charge electrostatics. Unit-cell dimensions of the validation set are typically reproduced to within 3% with the re-parameterized force fields. Lattice energies, which were all included during parameterization, are systematically underestimated when compared with measured sublimation enthalpies, with mean absolute errors of between 7.4 and 9.0%. PMID:27484370

  19. Measuring the van der Waals forces between a Rydberg atom and a metallic surface

    International Nuclear Information System (INIS)

    We have observed the deflection of Rydberg atoms towards a metallic surface by the van der Waals force. Cs and Na atoms in states of principal quantum number n were sent between two parallel gold-coated mirrors, spaced by a gap w (2.1 μm≤w≤8.5 μm). We measured the value n/sub m/ at which the transmission cuts off and from the variation of n/sub m/ versus w, we obtained a measure of the atom-surface interaction. For 12< n<30 this interaction is 3--4 orders of magnitude larger than for ground-state atoms, and it obeys the scaling laws of the Lennard-Jones model

  20. Electrical characterization of grain boundaries of CZTS thin films using conductive atomic force microscopy techniques

    Energy Technology Data Exchange (ETDEWEB)

    Muhunthan, N.; Singh, Om Pal [Compound Semiconductor Solar Cell, Physics of Energy Harvesting Division, New Delhi 110012 (India); Toutam, Vijaykumar, E-mail: toutamvk@nplindia.org [Quantum Phenomena and Applications Division, CSIR-National Physical Laboratory, Dr. K.S. Krishnan Marg, New Delhi 110012 (India); Singh, V.N., E-mail: singhvn@nplindia.org [Compound Semiconductor Solar Cell, Physics of Energy Harvesting Division, New Delhi 110012 (India)

    2015-10-15

    Graphical abstract: Experimental setup for conducting AFM (C-AFM). - Highlights: • Cu{sub 2}ZnSnS{sub 4} (CZTS) thin film was grown by reactive co-sputtering. • The electronic properties were probed using conducting atomic force microscope, scanning Kelvin probe microscopy and scanning capacitance microscopy. • C-AFM current flow mainly through grain boundaries rather than grain interiors. • SKPM indicated higher potential along the GBs compared to grain interiors. • The SCM explains that charge separation takes place at the interface of grain and grain boundary. - Abstract: Electrical characterization of grain boundaries (GB) of Cu-deficient CZTS (Copper Zinc Tin Sulfide) thin films was done using atomic force microscopic (AFM) techniques like Conductive atomic force microscopy (CAFM), Kelvin probe force microscopy (KPFM) and scanning capacitance microscopy (SCM). Absorbance spectroscopy was done for optical band gap calculations and Raman, XRD and EDS for structural and compositional characterization. Hall measurements were done for estimation of carrier mobility. CAFM and KPFM measurements showed that the currents flow mainly through grain boundaries (GB) rather than grain interiors. SCM results showed that charge separation mainly occurs at the interface of grain and grain boundaries and not all along the grain boundaries.

  1. NANOMECHANICAL MAPPING OF CARBON BLACK REINFORCED NATURAL RUBBER BY ATOMIC FORCE MICROSCOPY

    Institute of Scientific and Technical Information of China (English)

    Toshio Nishi; Hideyuki Nukaga; So Fujinami; Ken Nakajima

    2007-01-01

    Atomic force microscopy (AFM) has the advantage of obtaining mechanical properties as well as topographic information at the same time. By analyzing force-distance curves measured over two-dimensional area using Hertzian contact mechanics, Young's modulus mapping was obtained with nanometer-scale resolution. Furthermore, the sample deformation by the force exerted was also estimated from the force-distance curve analyses. We could thus reconstruct a real topographic image by incorporating apparent topographic image with deformation image. We applied this method to carbon black reinforced natural rubber to obtain Young's modulus distribution image together with reconstructed real topographic image.Then we were able to recognize three regions; rubber matrix, carbon black (or bound rubber) and intermediate regions.Though the existence of these regions had been investigated by pulsed nuclear magnetic resonance, this paper would be the first to report on the quantitative evaluation of the interfacial region in real space.

  2. Nanoscale mechanical probing of supported lipid bilayers with atomic force microscopy.

    Science.gov (United States)

    Das, Chinmay; Sheikh, Khizar H; Olmsted, Peter D; Connell, Simon D

    2010-10-01

    We present theory and experiments for the force-distance curve F(z(0)) of an atomic force microscope (AFM) tip (radius R) indenting a supported fluid bilayer (thickness 2d). For realistic conditions the force is dominated by the area compressibility modulus κ(A) of the bilayer and, to an excellent approximation, given by F=πκ(A)Rz(0)(2)/(2d-z(0))(2). The experimental AFM force curves from coexisting liquid ordered and liquid disordered domains in three-component lipid bilayers are well described by our model, which provides κ(A) in agreement with literature values. The liquid ordered phase has a yieldlike response that we model as due to the breaking of hydrogen bonds. PMID:21230326

  3. Mechanical Properties of Membrane Surface of Cultured Astrocyte Revealed by Atomic Force Microscopy

    Science.gov (United States)

    Shiga, Hatsuki; Yamane, Yukako; Ito, Etsuro; Abe, Kazuhiro; Kawabata, Kazushige; Haga, Hisashi

    2000-06-01

    In order to examine the mechanical properties of the membrane surface of astrocytes, we observed living astrocytes by atomic force microscopy (AFM) both in contact mode and force-mapping mode. Ridge-like structures reflecting actin filaments were observed in the topographic images in contact mode, but not in force-mapping mode, using a zero-loading force. When we measured the elasticity of astrocytes, we observed that the cell membrane above the nucleus was soft and the cell membrane above the cytosol was stiff. In particular, the parts reflecting actin filaments were very stiff. This effect of actin filaments on the elasticity of astrocytes was confirmed by the loss of actin filaments after application of actin-polymerization inhibitor.

  4. Accurate spring constant calibration for very stiff atomic force microscopy cantilevers

    Energy Technology Data Exchange (ETDEWEB)

    Grutzik, Scott J.; Zehnder, Alan T. [Field of Theoretical and Applied Mechanics, Cornell University, Ithaca, New York 14853 (United States); Gates, Richard S.; Gerbig, Yvonne B.; Smith, Douglas T.; Cook, Robert F. [Nanomechanical Properties Group, Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States)

    2013-11-15

    There are many atomic force microscopy (AFM) applications that rely on quantifying the force between the AFM cantilever tip and the sample. The AFM does not explicitly measure force, however, so in such cases knowledge of the cantilever stiffness is required. In most cases, the forces of interest are very small, thus compliant cantilevers are used. A number of methods have been developed that are well suited to measuring low stiffness values. However, in some cases a cantilever with much greater stiffness is required. Thus, a direct, traceable method for calibrating very stiff (approximately 200 N/m) cantilevers is presented here. The method uses an instrumented and calibrated nanoindenter to determine the stiffness of a reference cantilever. This reference cantilever is then used to measure the stiffness of a number of AFM test cantilevers. This method is shown to have much smaller uncertainty than previously proposed methods. An example application to fracture testing of nanoscale silicon beam specimens is included.

  5. Nano-scale mechanical probing of supported lipid bilayers with atomic force microscopy

    CERN Document Server

    Das, Chinmay; Olmsted, Peter D; Connell, Simon D

    2010-01-01

    We present theory and experiments for the force-distance curve $F(z_0)$ of an atomic force microscope (AFM) tip (radius $R$) indenting a supported fluid bilayer (thickness $2d$). For realistic conditions the force is dominated by the area compressibility modulus $\\kappa_A$ of the bilayer, and, to an excellent approximation, given by $F= \\pi \\kappa_A R z_0^2/(2d-z_0)^2$. The experimental AFM force curves from coexisting liquid ordered and liquid disordered domains in 3-component lipid bilayers are well-described by our model, and provides $\\kappa_A$ in agreement with literature values. The liquid ordered phase has a yield like response that we model by hydrogen bond breaking.

  6. Modeling and boundary force control of microcantilevers utilized in atomic force microscopy for cellular imaging and characterization

    Science.gov (United States)

    Eslami, Sohrab

    This dissertation undertakes the theoretical and experimental developments microcantilevers utilized in Atomic Force Microscopy (AFM) with applications to cellular imaging and characterization. The capability of revealing the inhomogeneties or interior of ultra-small materials has been of most interest to many researchers. However, the fundamental concept of signal and image formation remains unexplored and not fully understood. For his, a semi-empirical nonlinear force model is proposed to show that virtual frequency generation, regarded as the simplest synthesized subsurface probe, occurs optimally when the force is tuned to the van der Waals form. This is the first-time observation of a novel theoretical dynamic multi-frequency force microscopy that has not been already reported. Owing to the broad applications of microcantilevers in the nanoscale imaging and microscopic techniques, there is an essential feeling to study and propose a comprehensive model of such systems. Therefore, in the theoretical part of this dissertation, a distributed-parameters representation modeling of the microcantilever along with a general interaction force comprising of two attractive and repulsive components with general amplitude and power terms is studied. This model is investigated in a general 2D Cartesian coordinate to consider the motions of the probe with a tip mass. There is an excitation at the microcantilever's base such that the end of the beam is subject to the proposed general force. These forces are very sensitive to the amplitude and power terms of these parts; on the other hand, atomic intermolecular force is a function of the distance such that this distance itself is also a function of the interaction force that will result in a nonlinear implicit equation. From a parametric study in the probe-sample excitation, it is shown that the predicted behavior of the generated difference-frequency oscillation amplitude agrees well with experimental measurements. Following

  7. Derivation of Inter-Atomic Force Constants of Cu2O from Diffuse Neutron Scattering Measurement

    International Nuclear Information System (INIS)

    Neutron scattering intensity from Cu2O compound has been measured at 10 K and 295 K with High Resolution Powder Diffractometer at JRR-3 JAEA. The oscillatory diffuse scattering related to correlations among thermal displacements of atoms was observed at 295 K. The correlation parameters were determined from the observed diffuse scattering intensity at 10 and 295 K. The force constants between the neighboring atoms in Cu2O were estimated from the correlation parameters and compared to those of Ag2O (author)

  8. A low‐temperature atomic force/scanning tunneling microscope for ultrahigh vacuum

    OpenAIRE

    Giessibl, Franz J.; Gerber, Christoph; Binnig, Gerd

    1991-01-01

    We have built an ultrahigh vacuum atomic force/scanning tunneling microscope that works at 4.2 K. The microscope is incorporated into a very small chamber (100 ml) which can be evacuated and baked to UHV within a few hours by a specially designed valve. The instrument is about 20×20×70 mm3 in size and sturdy enough to operate without vibration isolation. The deflection of a microfabricated cantilever is detected by electron tunneling. Preliminary results show atomic resolution of HOPG in the ...

  9. Inter-atomic force constants of BaF{sub 2} by diffuse neutron scattering measurement

    Energy Technology Data Exchange (ETDEWEB)

    Sakuma, Takashi, E-mail: sakuma@mx.ibaraki.ac.jp; Makhsun,; Sakai, Ryutaro [Institute of Applied Beam Science, Ibaraki University, Mito 310-8512 (Japan); Xianglian [College of Physics and Electronics Information, Inner Mongolia University for the Nationalities, Tongliao 028043 (China); Takahashi, Haruyuki [Institute of Applied Beam Science, Ibaraki University, Hitachi 316-8511 (Japan); Basar, Khairul [Faculty of Mathematics and Natural Sciences, Institut Teknologi Bandung, Bandung 40132 (Indonesia); Igawa, Naoki [Quantum Beam Science Directorate, Japan Atomic Energy Agency, Tokai 319-1195 (Japan); Danilkin, Sergey A. [Bragg Institute, Australian Nuclear Science and Technology Organisation, Kirrawee DC NSW 2232 (Australia)

    2015-04-16

    Diffuse neutron scattering measurement on BaF{sub 2} crystals was performed at 10 K and 295 K. Oscillatory form in the diffuse scattering intensity of BaF{sub 2} was observed at 295 K. The correlation effects among thermal displacements of F-F atoms were obtained from the analysis of oscillatory diffuse scattering intensity. The force constants among neighboring atoms in BaF{sub 2} were determined and compared to those in ionic crystals and semiconductors.

  10. [Comparison of cell elasticity analysis methods based on atomic force microscopy indentation].

    Science.gov (United States)

    Wang, Zhe; Hao, Fengtao; Chen, Xiaohu; Yang, Zhouqi; Ding, Chong; Shang, Peng

    2014-10-01

    In order to investigate in greater detail the two methods based on Hertz model for analyzing force-distance curve obtained by atomic force microscopy, we acquired the force-distance curves of Hela and MCF-7 cells by atomic force microscopy (AFM) indentation in this study. After the determination of contact point, Young's modulus in different indentation depth were calculated with two analysis methods of "two point" and "slope fitting". The results showed that the Young's modulus of Hela cell was higher than that of MCF-7 cell,which is in accordance with the F-actin distribution of the two types of cell. We found that the Young's modulus of the cells was decreased with increasing indentation depth and the curve trends by "slope fitting". This indicated that the "slope fitting" method could reduce the error caused by the miscalculation of contact point. The purpose of this study was to provide a guidance for researcher to choose an appropriate method for analyzing AFM indentation force-distance curve. PMID:25764725

  11. Competition of elastic and adhesive properties of carbon nanotubes anchored to atomic force microscopy tips

    International Nuclear Information System (INIS)

    In this paper we address the mechanical properties of carbon nanotubes anchored to atomic force microscopy (AFM) tips in a detailed analysis of experimental results and exhaustive description of a simple model. We show that volume elastic and surface adhesive forces both contribute to the dynamical AFM experimental signals. Their respective weights depend on the nanotube properties and on an experimental parameter: the oscillation amplitude. To quantify the elastic and adhesive contributions, a simple analytical model is used. It enables analytical expressions of the resonance frequency shift and dissipation that can be measured in the atomic force microscopy dynamical frequency modulation mode. It includes the nanotube adhesive contribution to the frequency shift. Experimental data for single-wall and multi-wall carbon nanotubes compare well to the model predictions for different oscillation amplitudes. Three parameters can be extracted: the distance necessary to unstick the nanotube from the surface and two spring constants corresponding to tube compression and to the elastic force required to overcome the adhesion force

  12. Radiation pressure excitation of Low Temperature Atomic Force & Magnetic Force Microscope (LT-AFM/MFM) for Imaging

    Science.gov (United States)

    Karci, Ozgur; Celik, Umit; Oral, Ahmet; NanoMagnetics Instruments Ltd. Team; Middle East Tech Univ Team

    2015-03-01

    We describe a novel method for excitation of Atomic Force Microscope (AFM) cantilevers by means of radiation pressure for imaging in an AFM for the first time. Piezo excitation is the most common method for cantilever excitation, but it may cause spurious resonance peaks. A fiber optic interferometer with 1310 nm laser was used both to measure the deflection of cantilever and apply a force to the cantilever in a LT-AFM/MFM from NanoMagnetics Instruments. The laser power was modulated at the cantilever`s resonance frequency by a digital Phase Lock Loop (PLL). The force exerted by the radiation pressure on a perfectly reflecting surface by a laser beam of power P is F = 2P/c. We typically modulate the laser beam by ~ 800 μW and obtain 10nm oscillation amplitude with Q ~ 8,000 at 2.5x10-4 mbar. The cantilever's stiffness can be accurately calibrated by using the radiation pressure. We have demonstrated performance of the radiation pressure excitation in AFM/MFM by imaging a hard disk sample between 4-300K and Abrikosov vortex lattice in BSCCO single crystal at 4K to for the first time.

  13. RAPID COMMUNICATION: Frequency and force modulation atomic force microscopy: low-impact tapping-mode imaging without bistability

    Science.gov (United States)

    Solares, Santiago D.

    2007-07-01

    Since the 1980s, atomic force microscopy (AFM) has rapidly developed into a versatile, high-resolution characterization technique, available in a variety of imaging modes. Within intermittent-contact tapping-mode, imaging bistability and sample mechanical damage continue to be two of the most important challenges faced daily by AFM users. Recently, a new double-control-loop tapping-mode imaging algorithm (frequency and amplitude modulation AFM, FAM-AFM) was proposed and evaluated within numerical simulations, demonstrating a reduction in the repulsive tip sample forces and the absence of bistability. This article presents a much simpler algorithm, frequency and force modulation AFM (FFM-AFM), which requires only a single control loop and offers the same benefits as FAM-AFM. The concept is applied to calculate the cross-sectional scan of a carbon nanotube sample resting on a silicon surface, which is then compared to a previously reported image obtained in conventional amplitude-modulation tapping-mode, shown to be in agreement with the experimental result.

  14. Submolecular Imaging by Noncontact Atomic Force Microscopy with an Oxygen Atom Rigidly Connected to a Metallic Probe.

    Science.gov (United States)

    Mönig, Harry; Hermoso, Diego R; Díaz Arado, Oscar; Todorović, Milica; Timmer, Alexander; Schüer, Simon; Langewisch, Gernot; Pérez, Rubén; Fuchs, Harald

    2016-01-26

    In scanning probe microscopy, the imaging characteristics in the various interaction channels crucially depend on the chemical termination of the probe tip. Here we analyze the contrast signatures of an oxygen-terminated copper tip with a tetrahedral configuration of the covalently bound terminal O atom. Supported by first-principles calculations we show how this tip termination can be identified by contrast analysis in noncontact atomic force and scanning tunneling microscopy (NC-AFM, STM) on a partially oxidized Cu(110) surface. After controlled tip functionalization by soft indentations of only a few angstroms in an oxide nanodomain, we demonstrate that this tip allows imaging an organic molecule adsorbed on Cu(110) by constant-height NC-AFM in the repulsive force regime, revealing its internal bond structure. In established tip functionalization approaches where, for example, CO or Xe is deliberately picked up from a surface, these probe particles are only weakly bound to the metallic tip, leading to lateral deflections during scanning. Therefore, the contrast mechanism is subject to image distortions, artifacts, and related controversies. In contrast, our simulations for the O-terminated Cu tip show that lateral deflections of the terminating O atom are negligible. This allows a detailed discussion of the fundamental imaging mechanisms in high-resolution NC-AFM experiments. With its structural rigidity, its chemically passivated state, and a high electron density at the apex, we identify the main characteristics of the O-terminated Cu tip, making it a highly attractive complementary probe for the characterization of organic nanostructures on surfaces. PMID:26605698

  15. Probing molecular interaction between transferrin and anti-transferrin by atomic force microscope

    Institute of Scientific and Technical Information of China (English)

    2006-01-01

    The interaction between transferrin (Tf) and its antibody was investigated by atomic force microscope. Tf-antibody was immobilized on the Au-coated glass slide, and the specific combination between antibody and antigen was also characterized by AFM. The results showed that holo-transferrin was jogged with anti-transferrin, and binded anti-tran- sferrin more tightly than apo-transferrin. The force- distance curves revealed that the affinity of anti-trans- ferrin and holo-transferrin was much stronger than that of apo-transferrin.

  16. Refined OPLS All-Atom Force Field for Saturated Phosphatidylcholine Bilayers at Full Hydration

    DEFF Research Database (Denmark)

    Maciejewski, A.; Pasenkiewicz-Gierula, M.; Cramariuc, O.; Vattulainen, I.; Rog, T.

    2014-01-01

    validation, and it is also one of the highly important and abundant lipid types, e.g., in lung surfactant. Overall, PCs have not been previously parametrized in the OPLS-AA force field; thus, there is a need to derive its bonding and nonbonding parameters for both the polar and nonpolar parts of the molecule......We report parametrization of dipalmitoyl-phosphatidylcholine (DPPC) in the framework of the Optimized Parameters for Liquid Simulations all-atom (OPLS-AA) force field. We chose DPPC as it is one of the most studied phospholipid species and thus has plenty of experimental data necessary for model...

  17. Free-standing biomimetic polymer membrane imaged with atomic force microscopy

    DEFF Research Database (Denmark)

    Rein, Christian; Pszon-Bartosz, Kamila Justyna; Jensen, Karin Bagger Stibius;

    2011-01-01

    Fluid polymeric biomimetic membranes are probed with atomic force microscopy (AFM) using probes with both normal tetrahedrally shaped tips and nanoneedle-shaped Ag2Ga rods. When using nanoneedle probes, the collected force volume data show three distinct membrane regions which match the expected...... membrane structure when spanning an aperture in a hydrophobic scaffold. The method used provides a general method for mapping attractive fluid surfaces. In particular, the nanoneedle probing allows for characterization of free-standing biomimetic membranes with thickness on the nanometer scale suspended...

  18. Single DNA molecule grafting and manipulation using a combined atomic force microscope and an optical tweezer

    Science.gov (United States)

    Shivashankar, G. V.; Libchaber, A.

    1997-12-01

    In this letter, we report on spatially selecting and grafting a DNA-tethered bead to an atomic force microscope (AFM) cantilever, using an optical tweezer. To quantify this technique, we measure force versus extension of a single DNA molecule using AFM. For such studies, we have developed a micromanipulation approach by combining an AFM, an optical tweezer, and visualization setup. The ability to select a single DNA polymer and specifically graft it to a localized position on a substrate opens up new possibilities in biosensors and bioelectronic devices.

  19. Communication: Atomic force detection of single-molecule nonlinear optical vibrational spectroscopy

    International Nuclear Information System (INIS)

    Atomic Force Microscopy (AFM) allows for a highly sensitive detection of spectroscopic signals. This has been first demonstrated for NMR of a single molecule and recently extended to stimulated Raman in the optical regime. We theoretically investigate the use of optical forces to detect time and frequency domain nonlinear optical signals. We show that, with proper phase matching, the AFM-detected signals closely resemble coherent heterodyne-detected signals. Applications are made to AFM-detected and heterodyne-detected vibrational resonances in Coherent Anti-Stokes Raman Spectroscopy (χ(3)) and sum or difference frequency generation (χ(2))

  20. Imaging elastic property of surfaces at nanoscale using atomic force microscope

    International Nuclear Information System (INIS)

    We present a simple technique to characterize and image the distribution of local elastic property using ultrasonic atomic force microscope (UAFM). We interpret the UAFM images using simple arguments. We have demonstrated the capability of the UAFM technique to image the distribution of the local elastic property of the sample surface and semi-quantitatively map the local stiffness of the sample surface using a few selected samples. The local stiffness of the sample surface was obtained by measuring the changes in the frequency of contact resonance peak values and could verify the same using force-distance measurement at the same regions on the sample surface.

  1. Robust operation and performance of integrated carbon nanotubes atomic force microscopy probes

    International Nuclear Information System (INIS)

    We present a complete characterization of carbon nanotubes-atomic force microscopy (CNT-AFM) probes to evaluate the cantilever operation and advanced properties originating from the CNTs. The fabrication consists of silicon probes tip-functionalized with multiwalled CNTs by microwave plasma enhanced chemical vapor deposition. A dedicated methodology has been defined to evaluate the effect of CNT integration into the Si cantilevers. The presence of the CNTs provides enhanced capability for sensing and durability, as demonstrated using dynamic and static modes, e.g. imaging, indentation and force/current characterization.

  2. Atomic Force Microscopy as a Tool for Applied Virology and Microbiology

    Science.gov (United States)

    Zaitsev, Boris

    2003-12-01

    Atomic force microscope (AFM) can be successfully used for simple and fast solution of many applied biological problems. In this paper the survey of the results of the application of atomic force microscope SolverP47BIO (NT-MDT, Russia) in State Research Center of Virology and Biotechnology "Vector" is presented. The AFM has been used: - in applied virology for the counting of viral particles and examination of virus-cell interaction; - in microbiology for measurements and indication of bacterial spores and cells; - in biotechnology for control of biotechnological processes and evaluation of the distribution of particle dimension for viral and bacterial diagnostic assays. The main advantages of AFM in applied researches are simplicity of the processing of sample preparation and short time of the examination.

  3. Topography and Mechanical Property Mapping of International Simple Glass Surfaces with Atomic Force Microscopy

    Energy Technology Data Exchange (ETDEWEB)

    Pierce, Eric M [ORNL

    2014-01-01

    Quantitative Nanomechanical Peak Force (PF-QNM) TappingModeTM atomic force microscopy measurements are presented for the first time on polished glass surfaces. The PF-QNM technique allows for topography and mechanical property information to be measured simultaneously at each pixel. Results for the international simple glass which represents a simplified version of SON68 glass suggests an average Young s modulus of 78.8 15.1 GPa is within the experimental error of the modulus measured for SON68 glass (83.6 2 GPa) with conventional approaches. Application of the PF-QNM technique will be extended to in situ glass corrosion experiments with the goal of gaining atomic-scale insights into altered layer development by exploiting the mechanical property differences that exist between silica gel (e.g., altered layer) and pristine glass surface.

  4. Higher order structure of short immunostimulatory oligonucleotides studied by atomic force microscopy

    International Nuclear Information System (INIS)

    Immunostimulatory CpG-DNA activates the innate immune system by binding to Toll-like receptor 9. Structurally different CpG-containing oligonucleotides trigger a different type of immune response while activating the same receptor. We therefore investigated the higher order structure of two different classes of immunostimulatory CpG-DNA. Class A, which contains a partly self-complementary sequence and poly-G ends, forms duplexes and nanoparticles in salt solution, while class B, which does not contain these features and is purely linear, does not form a duplex or nanoparticles. Results obtained here by high-resolution atomic force microscopy of classes A and B CpG-DNA, reflect these differences in secondary structure. Detailed structural analysis of the atomic force microscopy topographs is presented for two different sample preparation methods.

  5. Atomic force microscopy imaging to measure precipitate volume fraction in nickel-based superalloys

    International Nuclear Information System (INIS)

    In nickel-based superalloys, quantitative analysis of scanning electron microscopy images fails in providing accurate microstructural data, whereas more efficient techniques are very time-consuming. As an alternative approach, the authors propose to perform quantitative analysis of atomic force microscopy images of polished/etched surfaces (quantitative microprofilometry). This permits the measurement of microstructural parameters and the depth of etching, which is the main source of measurement bias. Thus, nonbiased estimations can be obtained by extrapolation of the measurements up to zero etching depth. In this article, the authors used this approach to estimate the volume fraction of γ' precipitates in a nickel-based superalloy single crystal. Atomic force microscopy images of samples etched for different times show definition, homogeneity, and contrast high enough to perform image analysis. The result after extrapolation is in very good agreement with volume fraction values available from published reports

  6. Atomic force microscopy study on human keratinocytes treated with HgCl{sub 2}

    Energy Technology Data Exchange (ETDEWEB)

    Lastella, M [Dipartimento di Scienze Biomediche, Universita di Foggia, Viale Pinto, 71100 Foggia (Italy); Lasalvia, M [Dipartimento di Scienze Mediche e del Lavoro, Universita di Foggia, Viale Pinto, 71100 Foggia (Italy); Perna, G [Dipartimento di Scienze Biomediche, Universita di Foggia, Viale Pinto, 71100 Foggia (Italy); Biagi, P F [Dipartimento Interateneo di Fisica, Universita di Bari, Via Amendola 173, 70126 Bari (Italy); Capozzi, V [Dipartimento di Scienze Biomediche, Universita di Foggia, Viale Pinto, 71100 Foggia (Italy)

    2007-04-15

    Morphological modifications of the cellular membrane of human keratinocytes treated with HgCl{sub 2} at different concentrations were investigated employing atomic force microscopy and Raman microspectroscopy techniques. Important changes in the surface structure of the keratinocytes membrane occur when this chemical treatment is performed. Mercury action gives rise to roughness and hole-like depressions, especially at cytotoxic concentration. Such surface features are mainly localized in peripheral zones of cells. Although the viability assay reveals that the exposure of keratinocytes to HgCl{sub 2} at a concentration of 10{sup -6} M has no cytotoxic effect, morphological modifications are also evident in cellular membrane at such concentration. Raman microspectroscopy measurements suggest that such morphological modifications are related to modifications occurring in the lipidic layer. Our findings show that atomic force microscopy can be a valid and useful tool in studying the changes in morphology of cells when exposed to chemical stress.

  7. Higher order structure of short immunostimulatory oligonucleotides studied by atomic force microscopy

    Energy Technology Data Exchange (ETDEWEB)

    Klein, Dionne C.G., E-mail: dionne.c.g.klein@ntnu.no [Department of Physics, Norwegian University of Science and Technology, N-7491, Trondheim (Norway); Department of Cancer Research and Molecular Medicine, Norwegian University of Science and Technology, N-7489, Trondheim (Norway); Latz, Eicke [Department of Cancer Research and Molecular Medicine, Norwegian University of Science and Technology, N-7489, Trondheim (Norway); Division of Infectious Diseases and Immunology, University of Massachusetts Medical School, 364 Plantation Street, Worcester, MA 01605 (United States); Institute of Innate Immunity, University Hospitals, University of Bonn, Sigmund-Freud-Str. 25, 53127 Bonn (Germany); Espevik, Terje [Department of Cancer Research and Molecular Medicine, Norwegian University of Science and Technology, N-7489, Trondheim (Norway); Stokke, Bjorn T. [Department of Physics, Norwegian University of Science and Technology, N-7491, Trondheim (Norway)

    2010-05-15

    Immunostimulatory CpG-DNA activates the innate immune system by binding to Toll-like receptor 9. Structurally different CpG-containing oligonucleotides trigger a different type of immune response while activating the same receptor. We therefore investigated the higher order structure of two different classes of immunostimulatory CpG-DNA. Class A, which contains a partly self-complementary sequence and poly-G ends, forms duplexes and nanoparticles in salt solution, while class B, which does not contain these features and is purely linear, does not form a duplex or nanoparticles. Results obtained here by high-resolution atomic force microscopy of classes A and B CpG-DNA, reflect these differences in secondary structure. Detailed structural analysis of the atomic force microscopy topographs is presented for two different sample preparation methods.

  8. A comparative study of surface energy data from atomic force microscopy and from contact angle goniometry

    International Nuclear Information System (INIS)

    Forces of adhesion have been measured for interactions involving self-assembled monolayers or polymer-film structures that had each been deposited onto a gold-coated glass substrate and a probing, gold-coated cantilever. The data have been fitted into mathematical models that allow the calculation of surface energy by considering the work done for the separation of the identically coated contacting surfaces. These values of surface energy are in close agreement with those from corresponding contact angle determinations, highlighting the potential usefulness of the technique for the study of surfaces at a resolution level approaching 1000 atoms. Comparative studies show that the employment of the atomic force microscopy technique may be preferable for the study of samples that are susceptible to penetration by liquids or for investigations under conditions that exceed the useful limits of conventional probing techniques involving liquids.

  9. A direct micropipette-based calibration method for atomic force microscope cantilevers

    OpenAIRE

    Liu, Baoyu; Yu, Yan; Yao, Da-Kang; Shao, Jin-Yu

    2009-01-01

    In this report, we describe a direct method for calibrating atomic force microscope (AFM) cantilevers with the micropipette aspiration technique (MAT). A closely fitting polystyrene bead inside a micropipette is driven by precisely controlled hydrostatic pressures to apply known loads on the sharp tip of AFM cantilevers, thus providing a calibration at the most functionally relevant position. The new method is capable of calibrating cantilevers with spring constants ranging from 0.01 to hundr...

  10. Error sources in atomic force microscopy for dimensional measurements: Taxonomy and modeling

    DEFF Research Database (Denmark)

    Marinello, F.; Voltan, A.; Savio, E.; Carmignato, S.; De Chiffre, Leonardo

    2010-01-01

    This paper aimed at identifying the error sources that occur in dimensional measurements performed using atomic force microscopy. In particular, a set of characterization techniques for errors quantification is presented. The discussion on error sources is organized in four main categories......: scanning system, tip-surface interaction, environment, and data processing. The discussed errors include scaling effects, squareness errors, hysteresis, creep, tip convolution, and thermal drift. A mathematical model of the measurement system is eventually described, as a reference basis for errors...

  11. Atomic force microscopy of surface relief in individual grains of fatigued 316L austenitic stainless steel

    Czech Academy of Sciences Publication Activity Database

    Man, Jiří; Obrtlík, Karel; Blochwitz, C.; Polák, Jaroslav

    2002-01-01

    Roč. 50, č. 15 (2002), s. 3767-3780. ISSN 1359-6454 R&D Projects: GA ČR GA106/00/D055; GA ČR GA106/01/0376 Institutional research plan: CEZ:AV0Z2041904 Keywords : fatigue * persistent slip band * atomic force microscopy Subject RIV: JL - Materials Fatigue, Friction Mechanics Impact factor: 3.104, year: 2002

  12. Visualization of Cellulose Microfibrils of Phyllostachys pubescens Fibers with Atomic Force Microscope

    Institute of Scientific and Technical Information of China (English)

    2008-01-01

    Atomic force microscope(AFM) was used to investigate the arrangement of cellulose microfibrils (CMF) in Moso bamboo (Phyllostachys pubescens) fibers. Two methods of sample preparation were used here for different purposes. The first method was chemical maceration with a mixture of hydrogen peroxide and glacial acetic acid, through which the obtained fibers were suitable for observing the orientation of CMF in the primary wal1. The other method was to prepare tangential microtomed sections with a thickness o...

  13. Enhanced endocytosis of nano-curcumin in nasopharyngeal cancer cells: An atomic force microscopy study

    Science.gov (United States)

    Prasanth, R.; Nair, Greshma; Girish, C. M.

    2011-10-01

    Recent studies in drug development have shown that curcumin can be a good competent due to its improved anticancer, antioxidant, anti-proliferative, and anti-inflammatory activities. A detailed real time characterization of drug (curcumin)-cell interaction is carried out in human nasopharyngeal cancer cells using atomic force microscopy. Nanocurcumin shows an enhanced uptake over micron sized drugs attributed to the receptor mediated route. Cell membrane stiffness plays a critical role in the drug endocytosis in nasopharyngeal cancer cells.

  14. Mapping of laser diode radiation intensity by atomic-force microscopy

    Science.gov (United States)

    Alekseev, P. A.; Dunaevskii, M. S.; Slipchenko, S. O.; Podoskin, A. A.; Tarasov, I. S.

    2015-09-01

    The distribution of the intensity of laser diode radiation has been studied using an original method based on atomic-force microscopy (AFM). It is shown that the laser radiation intensity in both the near field and transition zone of a high-power semiconductor laser under room-temperature conditions can be mapped by AFM at a subwavelength resolution. The obtained patterns of radiation intensity distribution agree with the data of modeling and the results of near-field optical microscopy measurements.

  15. Nano-scale observations of tattoo pigments in skin by atomic force microscopy.

    Science.gov (United States)

    Grant, Colin A; Twigg, Peter C; Tobin, Desmond J

    2015-01-01

    In this study, we have shown how particles in carbon black tattoo ink accumulate in the human skin dermis using fine-resolution atomic force microscopy, with which a single ink particle in the collagenous network can be imaged. This information further demonstrates that tattoo inks are nano-particles. Further, we have deposited a commercially available tattoo ink on a glass slide and calculated a range of volumes for single ink particles. PMID:25833630

  16. Polymerized LB films imaged with a combined atomic force microscope-fluorescence microscope

    OpenAIRE

    Putman, Constant A.J.; Hansma, Helen G.; Gaub, Hermann E.; Hansma, Paul K.

    1992-01-01

    The first results obtained with a new stand-alone atomic force microscope (AFM) integrated with a standard Zeiss optical fluorescence microscope are presented. The optical microscope allows location and selection of objects to be imaged with the high-resolution AFM. Furthermore, the combined microscope enables a direct comparison between features observed in the fluorescence microscope and those observed in the images obtained with the AFM, in air or under liquid. The cracks in polymerized La...

  17. Surface topography characterization using an atomic force microscope mounted on a coordinate measuring machine

    DEFF Research Database (Denmark)

    De Chiffre, Leonardo; Hansen, H.N; Kofod, N

    1999-01-01

    The paper describes the construction, testing and use of an integrated system for topographic characterization of fine surfaces on parts having relatively big dimensions. An atomic force microscope (AFM) was mounted on a manual three-coordinate measuring machine (CMM) achieving free positioning of...... areas traced in single scans of 40 mu m x 40 mu m. The results show that surface mapping on industrial surfaces is possible using the Least Mean Square alignment provided by the AFM software....

  18. Atomic force microscope based Kelvin probe measurements : application to an electrochemical reaction

    OpenAIRE

    Böhmisch, Mathias; Burmeister, Frank; Rettenberger, Armin; Zimmermann, Jörg; Boneberg, Johannes; Leiderer, Paul

    1997-01-01

    An atomic force microscope (AFM) was utilized as a Kelvin probe to determine work functions of several metals and semiconductors quantitarively. Most of the experimental data show excellent agreement with published values measured by photoemission. Variations in work functions as low as 5 mV could be detected with a typical lateral resolution of 20 nm. This method allowed us to analyze and explain the energetics of an electrochemical reaction on the surface of WSe2, which could be in situ ind...

  19. Quantification of tip-broadening in non-contact atomic force microscopy with carbon nanotube tips

    DEFF Research Database (Denmark)

    Meinander, Kristoffer; Jensen, Thomas N.; Simonsen, Soren B.;

    2012-01-01

    Carbon nanotube terminated atomic force microscopy (AFM) probes have been used for the imaging of 5 nm wide surface supported Pt nanoclusters by non-contact (dynamic mode) AFM in an ultra-high vacuum. The results are compared to AFM measurements done with conventional Si-tips, as well...... with geometrically limited conventional probes. Superior durability also stands out as a defining feature of carbon nanotube terminated probes, allowing them to give results with a greatly enhanced reproducibility....

  20. Identifying dynamic membrane structures with atomic-force microscopy and confocal imaging

    OpenAIRE

    Timmel, T.; Schuelke, M.; Spuler, S

    2014-01-01

    Combining the biological specificity of fluorescence microscopy with topographical features revealed by atomic force microscopy (AFM) provides new insights into cell biology. However, the lack of systematic alignment capabilities especially in scanning-tip AFM has limited the combined application approach as AFM drift leads to increasing image mismatch over time. We present an alignment correction method using the cantilever tip as a reference landmark. Since the precise tip position is known...

  1. Conductivity mapping of nanoparticles by torsional resonance tunneling atomic force microscopy

    Czech Academy of Sciences Publication Activity Database

    Prastani, C.; Vetushka, Aliaksi; Fejfar, Antonín; Nanu, M.; Nanu, D.; Rath, J.K.; Schropp, R.E.I.

    2012-01-01

    Roč. 101, č. 8 (2012), , "083107-1"-"083107-4". ISSN 0003-6951 R&D Projects: GA MŠk(CZ) LM2011026; GA MŠk 7E10061 EU Projects: European Commission(XE) 240826 - PolySiMode Institutional research plan: CEZ:AV0Z10100521 Keywords : atomic force microscopy * nanoparticles * tin compounds * tunnelling Subject RIV: BM - Solid Matter Physics ; Magnetism Impact factor: 3.794, year: 2012

  2. Atomic force microscope elastography reveals phenotypic differences in alveolar cell stiffness

    OpenAIRE

    Azeloglu, Evren U.; Bhattacharya, Jahar; COSTA, KEVIN D.

    2008-01-01

    To understand the connection between alveolar mechanics and key biochemical events such as surfactant secretion, one first needs to characterize the underlying mechanical properties of the lung parenchyma and its cellular constituents. In this study, the mechanics of three major cell types from the neonatal rat lung were studied; primary alveolar type I (AT1) and type II (AT2) epithelial cells and lung fibroblasts were isolated using enzymatic digestion. Atomic force microscopy indentation wa...

  3. Challenges and complexities of multifrequency atomic force microscopy in liquid environments

    OpenAIRE

    Solares, Santiago D

    2014-01-01

    This paper illustrates through numerical simulation the complexities encountered in high-damping AFM imaging, as in liquid enviroments, within the specific context of multifrequency atomic force microscopy (AFM). The focus is primarily on (i) the amplitude and phase relaxation of driven higher eigenmodes between successive tip–sample impacts, (ii) the momentary excitation of non-driven higher eigenmodes and (iii) base excitation artifacts. The results and discussion are mostly applicable to t...

  4. Direct observation of defect structure in protein crystals by atomic force and transmission electron microscopy.

    OpenAIRE

    Devaud, G; Furcinitti, P S; Fleming, J. C.; Lyon, M K; Douglas, K

    1992-01-01

    We have examined the structure of S-layers isolated from Sulfolobus acidocaldarius using atomic force microscopy (AFM) and transmission electron microscopy (TEM). From the AFM images, we were able to directly observe individual dimers of the crystal, defects in the crystal structure, and twin boundaries. We have identified two types of boundaries, one defined by a mirror plane and the other by a glide plane. This work shows that twin boundaries are highly structured regions that are directly ...

  5. On the adhesion between fine particles and nanocontacts : an atomic force microscope study

    OpenAIRE

    Farshchi Tabrizi, Mahdi

    2007-01-01

    Um die Handhabung von feinen Pulvern in industriellen Anwendungen zu optimieren, ist ein Verständnis der Wechselwirkungen zwischen einzelnen Pulverteilchen eine fundamentale Voraussetzung. Die Kräfte zwischen kolloidalen Teilchen bestimmen das Verhalten einer Reihe von Materialien wie Farben, Papier, Erdreich und eine Vielzahl industrieller Prozesse. Mit der Erfindung des Rasterkraftmikroskops (Atomic force microscope, AFM) wurde die direkte Messung der Wechselwirkung zwischen mikrometer-groß...

  6. Surprising volume change in PPy(DBS): An atomic force microscopy study

    DEFF Research Database (Denmark)

    Smela, E.; Gadegaard, N.

    1999-01-01

    Communication: Conjugated polymers such as polypyrrole (PPy) have potential use as artificial muscles or in microsystems such as valves for micro-fluid handling. One of the most important parameters in such uses is the magnitude of volume change during associated redox processes; however, until n...... estimates have varied greatly. Atomic force microscopy is reported here as allowing direct measurement of the in situ thickness change during oxidation and reduction of thin films of PPy doped with dodecylbenzenesulfonate....

  7. Quantum degeneracy in atomic point contacts revealed by chemical force and conductance

    Czech Academy of Sciences Publication Activity Database

    Sugimoto, Y.; Ondráček, Martin; Abe, M.; Pou, P.; Morita, S.; Perez, R.; Flores, F.; Jelínek, Pavel

    2013-01-01

    Roč. 111, č. 10 (2013), "106803-1"-"106803-5". ISSN 0031-9007 R&D Projects: GA ČR(CZ) GPP204/11/P578 Grant ostatní: GA AV ČR(CZ) M100101207 Institutional support: RVO:68378271 Keywords : scanning tunneling microscopy * atomic force microscopy * degenerate states * silicon surface * dangling bonds Subject RIV: BM - Solid Matter Physics ; Magnetism Impact factor: 7.728, year: 2013

  8. Atomic force microscopy reveals the mechanical design of a modular protein

    OpenAIRE

    Li, Hongbin; Oberhauser, Andres F.; Fowler, Susan B.; Clarke, Jane; Fernandez, Julio M.

    2000-01-01

    Tandem modular proteins underlie the elasticity of natural adhesives, cell adhesion proteins, and muscle proteins. The fundamental unit of elastic proteins is their individually folded modules. Here, we use protein engineering to construct multimodular proteins composed of Ig modules of different mechanical strength. We examine the mechanical properties of the resulting tandem modular proteins by using single protein atomic force microscopy. We show that by combining modules of known mechanic...

  9. Effect of hydration film on scanning images of atomic force microscope

    Institute of Scientific and Technical Information of China (English)

    2006-01-01

    A standard calibration grating was used for image scanning to investigate the effect of hydration films on imaging resolution by Atomic Force Microscope (AFM). The results showed that the hydration films greatly affect the imaging resolution for the tapping mode, but no evident effect on the contact mode. The possible reasons for the effect of hydration films on scanning images of AFM are also brought forward here.

  10. Study of a Model Humic Acid-type Polymer by Fluorescence Spectroscopy and Atomic Force Microscopy

    OpenAIRE

    Marcos Antonio Piza; Nelson Consolin-Filho; Sérgio da Costa Saab; Daiana Kotra Deda; Fábio de Lima Leite; Marcilene Ferrari Barriquello; Ladislau Martin-Neto

    2012-01-01

    A model HA-type polymer of para-benzoquinone synthetic humic acid (SHA) and its complexes with copper, iron and manganese metal ions were studied using atomic force microscopy (AFM). Natural humic acids (HA) and synthetic humic acids (SHA) were examined by fluorescence spectroscopy, which indicated similarity of SHA and HA spectra. The AFM images of SHA and its complexes revealed variable morphologies, such as small spheres, aggregates and a sponge-like structure. The SHA complexes displayed ...

  11. Temperature induced healing in strained bituminous materials observed by atomic force microscopy

    OpenAIRE

    Nahar, S.N.; Schmets, A. J. M.; Scarpas, A.; Schitter, G.

    2013-01-01

    Bitumen is the binder in the composite material named asphalt concrete. Under cyclic mechanical loading of traffic passing over the pavement, eventually damage will initiate in the pavement, leading to eventual structural failure. This damaging process is accelerated by time dependent change of the mechanical properties of asphalt concrete due to ageing mechanisms like oxidation. Bitumen displays spatial heterogeneity at the micrometer scale, which has been observed by atomic force microscopy...

  12. Atomic force microscopy reveals differences in cell membrane properties in nuclear myosin I mutant

    Czech Academy of Sciences Publication Activity Database

    Venit, Tomáš; Rohožková, Jana; Kalendová, Alžběta; Hozák, Pavel

    Praha : ČSMS, 2013. s. 25-25. [Mikroskopie 2013. 13.05.2013-14.05.2013, Lednice] R&D Projects: GA ČR GAP305/11/2232; GA TA ČR TE01020118; GA MŠk LH12143 Institutional research plan: CEZ:AV0Z50520514 Institutional support: RVO:68378050 Keywords : atomic force microscopy * cell membrane * myosin 1C * NM1 * nuclear myosin I

  13. Atomic force microscopy: a powerful tool for high-resolution imaging of spermatozoa

    OpenAIRE

    Sen Prasenjit; Chaudhury Koel; Kumar Sunil; Guha Sujoy K

    2005-01-01

    Abstract Atomic force microscopy (AFM) has emerged as the only technique capable of real-time imaging of the surface of a living cell at nano-resolution. Since AFM provides the advantage of directly observing living biological cells in their native environment, this technique has found many applications in pharmacology, biotechnology, microbiology, structural and molecular biology, genetics and other biology-related fields. AFM has also proved to be a valuable tool for reproductive biologists...

  14. Stiffness and heterogeneity of the pulmonary endothelial glycocalyx measured by atomic force microscopy

    OpenAIRE

    O'Callaghan, Ryan; Job, Kathleen M.; Dull, Randal O; Hlady, Vladimir

    2011-01-01

    The mechanical properties of endothelial glycocalyx were studied using atomic force microscopy with a silica bead (diameter ∼18 μm) serving as an indenter. Even at indentations of several hundred nanometers, the bead exerted very low compressive pressures on the bovine lung microvascular endothelial cell (BLMVEC) glycocalyx and allowed for an averaging of stiffness in the bead-cell contact area. The elastic modulus of BLMVEC glycocalyx was determined as a pointwise function of the indentation...

  15. Use of atomic force microscopy (AFM) for microfabric study of cohesive soils.

    Science.gov (United States)

    Sachan, A

    2008-12-01

    Microfabric reflects the imprints of the geologic and stress history of the soil deposit, the depositional environment and weathering history. Many investigators have been concerned with the fundamental problem of how the engineering properties of clay depend on the microfabric, which can be defined as geometric arrangement of particles within the soil mass. It is believed that scanning electron microscopy (SEM) and transmission electron microscopy (TEM) are the only techniques that can reveal particle arrangements of clayey soils directly; however, current research introduces a novel and more advanced technique, atomic force microscopy, to evaluate the microfabric of cohesive materials. The atomic force microscopy has several advantages over SEM/TEM for characterizing cohesive particles at the sub-micrometre range by providing 3D images and 2D images with Z-information used in quantitative measurements of soil microfabric using SPIP software, and having the capability of obtaining images in all environments (ambient air, liquids and vacuums). This paper focuses on the use of atomic force microscopy technique to quantify the microfabric of clayey soils by developing the criteria for average and maximum values of angle of particle orientation within the soil mass using proposed empirical equations for intermediate and extreme microfabrics (dispersed, flocculated). PMID:19094019

  16. Raman-atomic force microscopy of the ommatidial surfaces of Dipteran compound eyes

    Science.gov (United States)

    Anderson, Mark S.; Gaimari, Stephen D.

    2003-01-01

    The ommatidial lens surfaces of the compound eyes in several species of files (Insecta: Diptera) and a related order (Mecoptera) were analyzed using a recently developed Raman-atomic force microscope. We demonstrate in this work that the atomic force microscope (AFM) is a potentially useful instrument for gathering phylogenetic data and that the newly developed Raman-AFM may extend this application by revealing nanometer-scale surface chemistry. This is the first demonstration of apertureless near-field Raman spectroscopy on an intact biological surface. For Chrysopilus testaceipes Bigot (Rhagionidae), this reveals unique cerebral cortex-like surface ridges with periodic variation in height and surface chemistry. Most other Brachyceran flies, and the "Nematoceran" Sylvicola fenestralis (Scopoli) (Anisopodidae), displayed the same morphology, while other taxa displayed various other characteristics, such as a nodule-like (Tipula (Triplicitipula) sp. (Tipulidae)) or coalescing nodule-like (Tabanus punctifer Osten Sacken (Tabanidae)) morphology, a smooth morphology with distinct pits and grooves (Dilophus orbatus (Say) (Bibionidae)), or an entirely smooth surface (Bittacus chlorostigma MacLachlan (Mecoptera: Bittacidae)). The variation in submicrometer structure and surface chemistry provides a new information source of potential phylogenetic importance, suggesting the Raman-atomic force microscope could provide a new tool useful to systematic and evolutionary inquiry.

  17. Harnessing the damping properties of materials for high-speed atomic force microscopy

    Science.gov (United States)

    Adams, Jonathan D.; Erickson, Blake W.; Grossenbacher, Jonas; Brugger, Juergen; Nievergelt, Adrian; Fantner, Georg E.

    2016-02-01

    The success of high-speed atomic force microscopy in imaging molecular motors, enzymes and microbes in liquid environments suggests that the technique could be of significant value in a variety of areas of nanotechnology. However, the majority of atomic force microscopy experiments are performed in air, and the tapping-mode detection speed of current high-speed cantilevers is an order of magnitude lower in air than in liquids. Traditional approaches to increasing the imaging rate of atomic force microscopy have involved reducing the size of the cantilever, but further reductions in size will require a fundamental change in the detection method of the microscope. Here, we show that high-speed imaging in air can instead be achieved by changing the cantilever material. We use cantilevers fabricated from polymers, which can mimic the high damping environment of liquids. With this approach, SU-8 polymer cantilevers are developed that have an imaging-in-air detection bandwidth that is 19 times faster than those of conventional cantilevers of similar size, resonance frequency and spring constant.

  18. The mechanisms underlying the enhanced resolution of atomic force microscopy with functionalized tips

    International Nuclear Information System (INIS)

    By functionalizing the tip of an atomic force microscope (AFM) with a molecule or an atom that significantly contributes to the tip-sample interaction, the resolution can be dramatically enhanced. The interaction and therefore the resolution crucially depend on the chemical nature of the tip termination. Employing a tip functionalized with a CO molecule, atomic resolution of a pentacene molecule was recently demonstrated. In this work, the interaction between the CO tip and the pentacene imaged are studied with first principles calculations. The calculated frequency shifts compare very well with the experiment. The different energy contributions are analyzed and the Pauli energy is computed. We demonstrate that the source of the high resolution is Pauli repulsion, whereas van der Waals and electrostatic interactions only add a diffuse attractive background.

  19. Measurements on hydrophobic and hydrophilic surfaces using a porous gamma alumina nanoparticle aggregate mounted on Atomic Force Microscopy cantilevers

    NARCIS (Netherlands)

    Das, Theerthankar; Becker, Thomas; Nair, Balagopal N.

    2010-01-01

    Atomic Force Microscopy (AFM) measurements are extensively used for a detailed understanding of molecular and surface forces. In this study, we present a technique for measuring such forces, using an AFM cantilever attached with a porous gamma alumina nanoparticle aggregate. The modified cantilever

  20. First principles calculation of current-induced forces in atomic gold contacts

    Science.gov (United States)

    Brandbyge, Mads; Stokbro, Kurt; Taylor, Jeremy; Mozos, Jose-Luis; Ordejon, Pablo

    2002-03-01

    We have recently developed an first principles method [1] for calculating the electronic structure, electronic transport, and forces acting on the atoms, for atomic scale systems connected to semi-infinite electrodes and with an applied voltage bias. Our method is based on the density functional theory (DFT) as implemented in the well tested SIESTA program [2]. We fully deal with the atomistic structure of the whole system, treating both the contact and the electrodes on the same footing. The effect of the finite bias (including selfconsistency and the solution of the electrostatic problem) is taken into account using nonequilibrium Green's functions. In this talk we show results for the forces acting on the contact atoms due to the nonequilibrium situation in the electronic subsystem, i.e. in the presence of an electronic current. We concentrate on one atom wide gold contacts/wires connected to bulk gold electrodes. References [1] Our implementation is called TranSIESTA and is described in M. Brandbyge, J. Taylor, K. Stokbro, J-L. Mozos, and P. Ordejon, cond-mat/0110650 [2] D. Sanchez-Portal, P. Ordejon, E. Artacho and J. Soler, Int. J. Quantum Chem. 65, 453 (1997).

  1. Minimal Basis Iterative Stockholder: Atoms in Molecules for Force-Field Development

    CERN Document Server

    Verstraelen, Toon; Heidar-Zadeh, Farnaz; Vanduyfhuys, Louis; Van Speybroeck, Veronique; Waroquier, Michel; Ayers, Paul W

    2016-01-01

    Atomic partial charges appear in the Coulomb term of many force-field models and can be derived from electronic structure calculations with a myriad of atoms-in-molecules (AIM) methods. More advanced models have also been proposed, using the distributed nature of the electron cloud and atomic multipoles. In this work, an electrostatic force field is defined through a concise approximation of the electron density, for which the Coulomb interaction is trivially evaluated. This approximate "pro-density" is expanded in a minimal basis of atom-centered s-type Slater density functions, whose parameters are optimized by minimizing the Kullback-Leibler divergence of the pro-density from a reference electron density, e.g. obtained from an electronic structure calculation. The proposed method, Minimal Basis Iterative Stockholder (MBIS), is a variant of the Hirshfeld AIM method but it can also be used as a density-fitting technique. An iterative algorithm to refine the pro-density is easily implemented with a linear-sca...

  2. Modular apparatus for electrostatic actuation of common atomic force microscope cantilevers

    International Nuclear Information System (INIS)

    Piezoelectric actuation of atomic force microscope (AFM) cantilevers often suffers from spurious mechanical resonances in the loop between the signal driving the cantilever and the actual tip motion. These spurious resonances can reduce the accuracy of AFM measurements and in some cases completely obscure the cantilever response. To address these limitations, we developed a specialized AFM cantilever holder for electrostatic actuation of AFM cantilevers. The holder contains electrical contacts for the AFM cantilever chip, as well as an electrode (or electrodes) that may be precisely positioned with respect to the back of the cantilever. By controlling the voltages on the AFM cantilever and the actuation electrode(s), an electrostatic force is applied directly to the cantilever, providing a near-ideal transfer function from drive signal to tip motion. We demonstrate both static and dynamic actuations, achieved through the application of direct current and alternating current voltage schemes, respectively. As an example application, we explore contact resonance atomic force microscopy, which is a technique for measuring the mechanical properties of surfaces on the sub-micron length scale. Using multiple electrodes, we also show that the torsional resonances of the AFM cantilever may be excited electrostatically, opening the door for advanced dynamic lateral force measurements with improved accuracy and precision

  3. Probing deviations from traditional colloid filtration theory by atomic forces microscopy.

    Energy Technology Data Exchange (ETDEWEB)

    Reno, Marissa Devan

    2005-12-01

    Colloid transport through saturated media is an integral component of predicting the fate and transport of groundwater contaminants. Developing sound predictive capabilities and establishing effective methodologies for remediation relies heavily on our ability to understand the pertinent physical and chemical mechanisms. Traditionally, colloid transport through saturated media has been described by classical colloid filtration theory (CFT), which predicts an exponential decrease in colloid concentration with travel distance. Furthermore, colloid stability as determined by Derjaguin-Landau-Veney-Overbeek (DLVO) theory predicts permanent attachment of unstable particles in a primary energy minimum. However, recent studies show significant deviations from these traditional theories. Deposition in the secondary energy minimum has been suggested as a mechanism by which observed deviations can occur. This work investigates the existence of the secondary energy minimum as predicted by DLVO theory using direct force measurements obtained by Atomic Forces Microscopy. Interaction energy as a function of separation distance between a colloid and a quartz surface in electrolyte solutions of varying ionic strength are obtained. Preliminary force measurements show promise and necessary modifications to the current experimental methodology have been identified. Stringent surface cleaning procedures and the use of high-purity water for all injectant solutions is necessary for the most accurate and precise measurements. Comparisons between direct physical measurements by Atomic Forces Microscopy with theoretical calculations and existing experimental findings will allow the evaluation of the existence or absence of a secondary energy minimum.

  4. A study of molecular adsorption of a cationic surfactant on complex surfaces with atomic force microscopy.

    Science.gov (United States)

    Sokolov, I; Zorn, G; Nichols, J M

    2016-02-01

    The study of molecular adsorption on solid surfaces is of broad interest. However, so far the study has been restricted to idealized flat smooth rigid surfaces which are rarely the case in real world applications. Here we describe a study of molecular adsorption on a complex surface of the submicron fibers of a fibrous membrane of regenerated cellulose in aqueous media. We use a cationic surfactant, cetyltrimethylammonium chloride (CTAC), as the adsorbing molecule. We study the equilibrium adsorption of CTAC molecules on the same area of the fibers by sequentially immersing the membrane in pure water, 1 mM and then a 20 mM solution of CTAC. Atomic force microscopy (AFM) is applied to study the adsorption. The force-volume mode is used to record the force-deformation curves of the adsorbed molecules on the fiber surface. We suggest a model to separate the forces due to the adsorbed molecules from the elastic deformation of the fiber. Interestingly, knowledge of the surface geometry is not required in this model provided the surface is made of elastically homogeneous material. Different models are investigated to estimate the amount of the adsorbed molecules based on the obtained force curves. The exponential steric repulsion model fits the force data the best. The amount of the adsorbed surfactant molecules and its dependence on the concentration are found to be reasonable compared to the data previously measured by means of Raman scattering done on a flat surface of silica. PMID:26730682

  5. Determination of adhesion between single Aspergillus niger spores in aqueous solutions using an atomic force microscope.

    Science.gov (United States)

    Wargenau, Andreas; Kwade, Arno

    2010-07-01

    The interaction force between single cells in contact is of high interest in various interdisciplinary fields of biotechnology, for instance, in cultivation or biofilm formation. A method for the determination of adhesion forces between two single Aspergillus niger spores in different aqueous solutions was established in this study. Adhesion force distributions were determined at three different sodium chloride concentrations and two different pH values using an atomic force microscope (AFM). It was pointed out that adhesion data can be described by log-normal density functions, of which corresponding parameters have been estimated. Using the knowledge of distribution shape, the influence of the environmental condition on the mean values of adhesion force could be studied quantitatively. The highest value of 0.95 nN was observed at pH 2.5 and an ionic strength of 0.5 mol L(-1). Decreasing the ionic strength to 0.05 mol L(-1) decreases the adhesion force mean for about 25%. Increasing the pH value to pH 5 at a sodium chloride concentration of 0.154 mol L(-1) entails a decrease of adhesion from 0.88 to 0.56 nN. These results qualitatively agree with the absolute value of the expected surface potential of Aspergillus niger spores, which is much higher at pH 5 and should take more effect at lower concentrations of counterions. PMID:20387816

  6. Calibration of the lateral spring constant of atomic force microscope cantilevers

    Science.gov (United States)

    Song, Yunpeng; Wu, Sen; Xu, Linyan; Fu, Xing

    2015-10-01

    Atomic force microscope (AFM) is very useful in nano-scale force measurement. Lateral force is typically used in nanoscratch and surface friction measurement based on AFM. As one of the most important parameters to obtain lateral force, the lateral spring constant of AFM cantilever probe is of great significance and needs to be quantitative calibrated. Lateral torsion and lateral force of the cantilever are two parameters need to be measured in lateral spring constant calibration. In this article, we develop a calibration system and introduce a calibration method using an AFM head and an electromagnetic balance. An aluminium column with a known angel on top is placed on the weighing pan of the balance. The cantilever is precisely positioned in the AFM head, then approaches and bends on the aluminium column. During this procedure, the bending force and the lateral torsion of the cantilever are synchronously measured by the balance and an optical lever system, respectively. Then the lateral spring constant is calculated with a formula. By using this method, three kinds of rectangular cantilever are calibrated. The relative standard deviations of the calibration results are smaller than 2%.

  7. Fabrication of metal oxide nanostructures based on Atomic Force Microscopy lithography

    Institute of Scientific and Technical Information of China (English)

    2008-01-01

    Atomic Force Microscopy (AFM) mechanical lithography is a simple but significant method for nanofabrication. In this work, we used this method to construct nanos- tructures on Pt/Cu bilayer metal electrodes under ambient conditions in air. The influence of various scratch parameters, such as the applied force, scan velocity and circle times, on the lithography patterns was investigated. The Pt-Cu-CuxO-Cu-Pt nanostructure was constructed by choosing suitable scratch parameters and oxidation at room temperature. The properties of the scratched regions were also investigated by friction force microscopy and conductive AFM (C-AFM). The I-V curves show symmetric and linear properties, and Ohmic contacts were formed. These results indicate that AFM mechanical lithography is a powerful tool for fabricating novel metal-semiconductor nanoelectronic devices.

  8. Structural evaluation of probucol nanoparticles in water by atomic force microscopy.

    Science.gov (United States)

    Moribe, Kunikazu; Limwikrant, Waree; Higashi, Kenjirou; Yamamoto, Keiji

    2012-05-10

    Structural evaluation of probucol nanoparticles coground with polyvinylpyrrolidone K17 and sodium dodecyl sulfate for 90 min was performed by solid-state nuclear magnetic resonance (NMR) spectroscopy and atomic force microscopy (AFM) with force-distance curve analysis. The results of solid-state NMR indicated that the cogrinding changed crystalline probucol to amorphous form. The number-averaged mean heights of probucol particles in the ground mixture (GM) suspension were determined by AFM to be 6 and 15 nm for freshly prepared and 24h-stored samples, respectively. Nucleation and the subsequent crystal growth might have occurred after the GM was dispersed in water. The presence of probucol nanocrystals and agglomeration of the primary probucol nanoparticles were recognized by AFM force-distance curve analysis. AFM could be a promising tool to evaluate the structure of nanoparticles as well as their agglomeration behavior in aqueous media. PMID:22370474

  9. Atomic Force Microscopy in Dynamic Mode with Displacement Current Detection in Double Cantilever Devices

    Science.gov (United States)

    Müller, Falk; Müller, Anne‑Dorothea; Hietschold, Michael; Gessner, Thomas

    2006-03-01

    A cantilever array for dynamic mode atomic force microscopy (AFM) is presented, the vertical displacement of which is analyzed by the detection of displacement currents in the electrodes. Each cantilever in the array consists of an actuation part that allows an independent vertical movement, and a sensor part. The lateral distance between the tips of the different cantilevers is fixed to 10 μm. When operated as an actuator, a voltage is applied between the silicon membrane and the underlaying electrode. Due to the resulting coulomb forces, the vertical position of the tip is controllable. The reaction time in this mode is shorter than the response time of a piezostack. The sensor part, on the other hand, allows the device to work in dynamic mode without a laser deflection system. The vertical resolution achieved is below 1 nm. The dependence of force distance curves on the excitation amplitude is shown.

  10. Nonlinear dynamic response of cantilever beam tip during atomic force microscopy (AFM) nanolithography of copper surface

    International Nuclear Information System (INIS)

    This paper investigates the nonlinear dynamic response of an atomic force microscope (AFM) cantilever beam tip during the nanolithography of a copper (Cu) surface using a high-depth feed. The dynamic motion of the tip is modeled using a combined approach based on Newton's law and empirical observations. The cutting force is determined from experimental observations of the piling height on the Cu surface and the rotation angle of the cantilever beam tip. It is found that the piling height increases linearly with the cantilever beam carrier velocity. Furthermore, the cantilever beam tip is found to execute a saw tooth motion. Both this motion and the shear cutting force are nonlinear. The elastic modulus in the y direction is variable. Finally, the velocity of the cantilever beam tip as it traverses the specimen surface has a discrete characteristic rather than a smooth, continuous profile

  11. A virtual instrument to standardise the calibration of atomic force microscope cantilevers

    CERN Document Server

    Sader, John E; Gibson, Christopher T; Haviland, David B; Higgins, Michael J; Kilpatrick, Jason I; Lu, Jianing; Mulvaney, Paul; Shearer, Cameron J; Slattery, Ashley D; Thorén, Per-Anders; Tran, Jim; Zhang, Heyou; Zhang, Hongrui; Zheng, Tian

    2016-01-01

    Atomic force microscope (AFM) users often calibrate the spring constants of cantilevers using functionality built into individual instruments. This is performed without reference to a global standard, which hinders robust comparison of force measurements reported by different laboratories. In this article, we describe a virtual instrument (an internet-based initiative) whereby users from all laboratories can instantly and quantitatively compare their calibration measurements to those of others - standardising AFM force measurements - and simultaneously enabling non-invasive calibration of AFM cantilevers of any geometry. This global calibration initiative requires no additional instrumentation or data processing on the part of the user. It utilises a single website where users upload currently available data. A proof-of-principle demonstration of this initiative is presented using measured data from five independent laboratories across three countries, which also allows for an assessment of current calibratio...

  12. Stronger constraints on axion from measuring the Casimir interaction by means of dynamic atomic force microscope

    CERN Document Server

    Bezerra, V B; Mostepanenko, V M; Romero, C

    2014-01-01

    We calculate the additional force due to two-axion exchange acting in a sphere-disc geometry, used in experiments on measuring the gradient of the Casimir force. With this result, stronger constraints on the pseudoscalar coupling constants of an axion and axion-like particles to a proton and a neutron are obtained over the wide range of axion masses from 0.03mV to 1eV. Among the three experiments with Au-Au, Au-Ni and Ni-Ni boundary surfaces performed by means of dynamic atomic force microscope, major improving is achieved for the experiment with Au-Au test bodies. Here, the constraints obtained are stronger up to a factor of 170, as compared to the previously known ones. The largest strengthening holds for the axion mass 0.3eV.

  13. Minimising the effect of nanoparticle deformation in intermittent contact amplitude modulation atomic force microscopy measurements

    Science.gov (United States)

    Babic, Bakir; Lawn, Malcolm A.; Coleman, Victoria A.; Jämting, Åsa K.; Herrmann, Jan

    2016-06-01

    The results of systematic height measurements of polystyrene (PS) nanoparticles using intermittent contact amplitude modulation atomic force microscopy (IC-AM-AFM) are presented. The experimental findings demonstrate that PS nanoparticles deform during AFM imaging, as indicated by a reduction in the measured particle height. This deformation depends on the IC-AM-AFM imaging parameters, material composition, and dimensional properties of the nanoparticles. A model for nanoparticle deformation occurring during IC-AM-AFM imaging is developed as a function of the peak force which can be calculated for a particular set of experimental conditions. The undeformed nanoparticle height can be estimated from the model by extrapolation to zero peak force. A procedure is proposed to quantify and minimise nanoparticle deformation during IC-AM-AFM imaging, based on appropriate adjustments of the experimental control parameters.

  14. Selective nano-patterning of graphene using a heated atomic force microscope tip

    International Nuclear Information System (INIS)

    In this study, we introduce a selective thermochemical nano-patterning method of graphene on insulating substrates. A tiny heater formed at the end of an atomic force microscope (AFM) cantilever is optimized by a finite element method. The cantilever device is fabricated using conventional micromachining processes. After preliminary tests of the cantilever device, nano-patterning experiments are conducted with various conducting and insulating samples. The results indicate that faster scanning speed and higher contact force are desirable to reduce the sizes of nano-patterns. With the experimental condition of 1 μm/s and 24 mW, the heated AFM tip generates a graphene oxide layer of 3.6 nm height and 363 nm width, on a 300 nm thick SiO2 layer, with a tip contact force of 100 nN

  15. Selective nano-patterning of graphene using a heated atomic force microscope tip

    Science.gov (United States)

    Choi, Young-Soo; Wu, Xuan; Lee, Dong-Weon

    2014-04-01

    In this study, we introduce a selective thermochemical nano-patterning method of graphene on insulating substrates. A tiny heater formed at the end of an atomic force microscope (AFM) cantilever is optimized by a finite element method. The cantilever device is fabricated using conventional micromachining processes. After preliminary tests of the cantilever device, nano-patterning experiments are conducted with various conducting and insulating samples. The results indicate that faster scanning speed and higher contact force are desirable to reduce the sizes of nano-patterns. With the experimental condition of 1 μm/s and 24 mW, the heated AFM tip generates a graphene oxide layer of 3.6 nm height and 363 nm width, on a 300 nm thick SiO2 layer, with a tip contact force of 100 nN.

  16. Finite element modeling of atomic force microscopy cantilever dynamics during video rate imaging

    International Nuclear Information System (INIS)

    A dynamic finite element model has been constructed to simulate the behavior of low spring constant atomic force microscope (AFM) cantilevers used for imaging at high speed without active feedback as in VideoAFM. The model is tested against experimental data collected at 20 frame/s and good agreement is found. The complex dynamics of the cantilever, consisting of traveling waves coming from the tip sample interaction, reflecting off the cantilever-substrate junction, and interfering with new waves created at the tip, are revealed. The construction of the image from this resulting nonequilibrium cantilever deflection is also examined. Transient tip-sample forces are found to reach values up to 260 nN on a calibration grid sample, and the maximum forces do not always correspond to the position of steepest features as a result of energy stored in the cantilever.

  17. Observation on Surface and Cross Section of Thin Film Solar Cells Using Atomic Force Microscope

    Institute of Scientific and Technical Information of China (English)

    FENG Liang-huan; WU Li-li; CAI Wei; CAI Ya-ping; ZHENG Jia-gui; ZHANG Jing-quan; LI Bing; LI Wei

    2005-01-01

    Atomic force microscope (AFM) is able to produce three-dimensional digital data in both forcemode and height-mode and its applications are not limited to map the surfaces of conducting materials. It can use the force-mode to image the repulsive and attractive force patterns. The cross sections of polycrystalline CdS/CdTe and amorphous silicon heterojunction solar cells are observed with AFM. In case of short circuit,the microstructures of different layers in the samples are clearly displayed. When the cells are open circuit, the topographical images are altered, the potential outline due to the space charge in junction region is observed.Obviously, AFM can be employed to investigate experimentally built-in potential in junction of semiconductor devices, such as solar cells.

  18. Investigating the adsorption of the gemini surfactant "12-2-12" onto mica using atomic force microscopy and surface force apparatus measurements

    NARCIS (Netherlands)

    Fielden, ML; Claesson, PM; Verrall, RE

    1999-01-01

    The adsorption of the cationic gemini surfactant 1,2-bis(n-dodecyldimethylammonium)ethane dibromide on mica was followed by measuring forces between mica surfaces and by atomic force microscopy (AFM) imaging. The surface charge was found to be neutralized at total surfactant concentrations between 8

  19. Shape-dependent adhesion and friction of Au nanoparticles probed with atomic force microscopy

    Science.gov (United States)

    Yuk, Youngji; Hong, Jong Wook; Lee, Hyunsoo; Han, Sang Woo; Park, Jeong Young

    2015-03-01

    The relation between surface structure and friction and adhesion is a long-standing question in tribology. Tuning the surface structure of the exposed facets of metal nanoparticles is enabled by shape control. We investigated the effect of the shape of Au nanoparticles on friction and adhesion. Two nanoparticle systems, cubic nanoparticles with a low-index (100) surface and hexoctahedral nanoparticles with a high-index (321) surface, were used as model nanoparticle surfaces. Atomic force microscopy was used to probe the nanoscale friction and adhesion on the nanoparticle surface. Before removing the capping layers, the friction results include contributions from both the geometric factor and the presence of capping layers. After removing the capping layers, we can see the exclusive effect of the surface atomic structure while the geometric effect is maintained. We found that after removing the capping layer, the cubic Au nanoparticles exhibited higher adhesion and friction, compared with cubes capped with layers covering 25% and 70%, respectively. On the other hand, the adhesion and friction of hexoctahedral Au nanoparticles decreased after removing the capping layers, compared with nanoparticles with capping layers. The difference in adhesion and friction forces between the bare Au surfaces and Au nanoparticles with capping layers cannot be explained by geometric factors, such as the slope of the nanoparticle surfaces. The higher adhesion and friction forces on cubic nanoparticles after removing the capping layers is associated with the atomic structure of (100) and (321) (i.e., the flat (100) surfaces of the cubic nanoparticles have a larger contact area, compared with the rough (321) surfaces of the hexoctahedral nanoparticles). This study implies an intrinsic relation between atomic structure and nanomechanical properties, with potential applications for controlling nanoscale friction and adhesion via colloid chemistry.

  20. The Polarizable Atomic Multipole-based AMOEBA Force Field for Proteins.

    Science.gov (United States)

    Shi, Yue; Xia, Zhen; Zhang, Jiajing; Best, Robert; Wu, Chuanjie; Ponder, Jay W; Ren, Pengyu

    2013-01-01

    Development of the AMOEBA (Atomic Multipole Optimized Energetics for Biomolecular Simulation) force field for proteins is presented. The current version (AMOEBA-2013) utilizes permanent electrostatic multipole moments through the quadrupole at each atom, and explicitly treats polarization effects in various chemical and physical environments. The atomic multipole electrostatic parameters for each amino acid residue type are derived from high-level gas phase quantum mechanical calculations via a consistent and extensible protocol. Molecular polarizability is modeled via a Thole-style damped interactive induction model based upon distributed atomic polarizabilities. Inter- and intramolecular polarization is treated in a consistent fashion via the Thole model. The intramolecular polarization model ensures transferability of electrostatic parameters among different conformations, as demonstrated by the agreement between QM and AMOEBA electrostatic potentials, and dipole moments of dipeptides. The backbone and side chain torsional parameters were determined by comparing to gas-phase QM (RI-TRIM MP2/CBS) conformational energies of dipeptides and to statistical distributions from the Protein Data Bank. Molecular dynamics simulations are reported for short peptides in explicit water to examine their conformational properties in solution. Overall the calculated conformational free energies and J-coupling constants are consistent with PDB statistics and experimental NMR results, respectively. In addition, the experimental crystal structures of a number of proteins are well maintained during molecular dynamics (MD) simulation. While further calculations are necessary to fully validate the force field, initial results suggest the AMOEBA polarizable multipole force field is able to describe the structure and energetics of peptides and proteins, in both gas-phase and solution environments. PMID:24163642

  1. Shape-dependent adhesion and friction of Au nanoparticles probed with atomic force microscopy

    International Nuclear Information System (INIS)

    The relation between surface structure and friction and adhesion is a long-standing question in tribology. Tuning the surface structure of the exposed facets of metal nanoparticles is enabled by shape control. We investigated the effect of the shape of Au nanoparticles on friction and adhesion. Two nanoparticle systems, cubic nanoparticles with a low-index (100) surface and hexoctahedral nanoparticles with a high-index (321) surface, were used as model nanoparticle surfaces. Atomic force microscopy was used to probe the nanoscale friction and adhesion on the nanoparticle surface. Before removing the capping layers, the friction results include contributions from both the geometric factor and the presence of capping layers. After removing the capping layers, we can see the exclusive effect of the surface atomic structure while the geometric effect is maintained. We found that after removing the capping layer, the cubic Au nanoparticles exhibited higher adhesion and friction, compared with cubes capped with layers covering 25% and 70%, respectively. On the other hand, the adhesion and friction of hexoctahedral Au nanoparticles decreased after removing the capping layers, compared with nanoparticles with capping layers. The difference in adhesion and friction forces between the bare Au surfaces and Au nanoparticles with capping layers cannot be explained by geometric factors, such as the slope of the nanoparticle surfaces. The higher adhesion and friction forces on cubic nanoparticles after removing the capping layers is associated with the atomic structure of (100) and (321) (i.e., the flat (100) surfaces of the cubic nanoparticles have a larger contact area, compared with the rough (321) surfaces of the hexoctahedral nanoparticles). This study implies an intrinsic relation between atomic structure and nanomechanical properties, with potential applications for controlling nanoscale friction and adhesion via colloid chemistry. (paper)

  2. [Atomic force field FFsol for calculation of molecular interactions of in water environment].

    Science.gov (United States)

    Pereiaslavets, L B; Finkel'shtein, A V

    2010-01-01

    Detailed calculations of protein interactions with explicitly considered water takes enormous computer time. The calculation becomes faster if water is considered implicitly (as a continuous media rather than as molecules); however, these calculations are much less precise, unless one uses an additional (and also volumes) computation of the solvent-accessible areas of protein atoms. The aim of our study was to obtain parameters for non-bonded atom-atom interactions for the case when water surrounding is considered implicitly and the solvent-accessible areas are not computed. Since the "in-vacuum" interactions of atoms are obtained from experimental structures of crystals and enthalpies of their sublimation, the "in-water" interactions of atoms must be corrected using solvation free energies of molecules, which can be obtained from the Henry constants. Taken 58 structures of molecular crystals and thermodynamic data on their sublimation and solubility, we obtained parameters for "in-water" attraction and repulsion of atoms typical of protein structures (H, C, N, O, S) in various covalently-bonded states, as well as parameters for electrostatic interactions. All necessary for calculations parameters of covalent interactions have been taken from the ENCAD force field, and partial charges of all atoms of separate molecules of a crystal have been obtained from quantum-mechanical calculations. The sought parameters of the "in-water" van der Waals and electrostatic interactions were optimized so as to achieve the best description of equilibrium crystal structures and their sublimation and solvation at the room temperature. With the optimized parameters, the average error in calculation of the effective cohesion energy of molecules in crystals was less than 10% both in the "in-vacuum" and "in-water" cases. PMID:20586195

  3. Optical Force on Two-level Atoms by Few-cycle Pulsed Gaussian Laser field beyond the Rotating Wave Approximation

    OpenAIRE

    Kumar, Parvendra; Sarma, Amarendra K.

    2011-01-01

    We report a study on light force on a beam of neutral two-level atoms superimposed upon a few-cycle pulsed Gaussian laser field under both resonant and off-resonant condition. The phenomena of focusing, defocusing and steering of the neutral atoms in the laser field is analysed by solving the optical Bloch equation beyond the rotating wave approximation and the force equation self-consistently .We find that two-level atoms in an atomic beam could be focused and defocused for large, positively...

  4. Improved in situ spring constant calibration for colloidal probe atomic force microscopy

    International Nuclear Information System (INIS)

    In colloidal probe atomic force microscopy (AFM) surface forces cannot be measured without an accurate determination of the cantilever spring constant. The effective spring constant k depends upon the cantilever geometry and therefore should be measured in situ; additionally, k may be coupled to other measurement parameters. For example, colloidal probe AFM is frequently used to measure the slip length b at solid/liquid boundaries by comparing the measured hydrodynamic force with Vinogradova slip theory (V-theory). However, in this measurement k and b are coupled, hence, b cannot be accurately determined without knowing k to high precision. In this paper, a new in situ spring constant calibration method based upon the residuals, namely, the difference between experimental force-distance data and V-theory is presented and contrasted with two other popular spring constant determination methods. In this residuals calibration method, V-theory is fitted to the experimental force-distance data for a range of systematically varied spring constants where the only adjustable parameter in V-theory is the slip length b. The optimal spring constant k is that value where the residuals are symmetrically displaced about zero for all colloidal probe separations. This residual spring constant calibration method is demonstrated by studying three different liquids (n-decanol, n-hexadecane, and n-octane) and two different silane coated colloidal probe-silicon wafer systems (n-hexadecyltrichlorosilane and n-dodecyltrichlorosilane).

  5. Individual globular domains and domain unfolding visualized in overstretched titin molecules with atomic force microscopy.

    Directory of Open Access Journals (Sweden)

    Zsolt Mártonfalvi

    Full Text Available Titin is a giant elastomeric protein responsible for the generation of passive muscle force. Mechanical force unfolds titin's globular domains, but the exact structure of the overstretched titin molecule is not known. Here we analyzed, by using high-resolution atomic force microscopy, the structure of titin molecules overstretched with receding meniscus. The axial contour of the molecules was interrupted by topographical gaps with a mean width of 27.7 nm that corresponds well to the length of an unfolded globular (immunoglobulin and fibronectin domain. The wide gap-width distribution suggests, however, that additional mechanisms such as partial domain unfolding and the unfolding of neighboring domain multimers may also be present. In the folded regions we resolved globules with an average spacing of 5.9 nm, which is consistent with a titin chain composed globular domains with extended interdomain linker regions. Topographical analysis allowed us to allocate the most distal unfolded titin region to the kinase domain, suggesting that this domain systematically unfolds when the molecule is exposed to overstretching forces. The observations support the prediction that upon the action of stretching forces the N-terminal ß-sheet of the titin kinase unfolds, thus exposing the enzyme's ATP-binding site and hence contributing to the molecule's mechanosensory function.

  6. Interpreting atomic force microscopy nanoindentation of hierarchical biological materials using multi-regime analysis.

    Science.gov (United States)

    Bonilla, M R; Stokes, J R; Gidley, M J; Yakubov, G E

    2015-02-01

    We present a novel Multi-Regime Analysis (MRA) routine for interpreting force indentation measurements of soft materials using atomic force microscopy. The MRA approach combines both well established and semi-empirical theories of contact mechanics within a single framework to deconvolute highly complex and non-linear force-indentation curves. The fundamental assumption in the present form of the model is that each structural contribution to the mechanical response acts in series with other 'mechanical resistors'. This simplification enables interpretation of the micromechanical properties of materials with hierarchical structures and it allows automated processing of large data sets, which is particularly indispensable for biological systems. We validate the algorithm by demonstrating for the first time that the elastic modulus of polydimethylsiloxane (PDMS) films is accurately predicted from both approach and retraction branches of force-indentation curves. For biological systems with complex hierarchical structures, we show the unique capability of MRA to map the micromechanics of live plant cells, revealing an intricate sequence of mechanical deformations resolved with precision that is unattainable using conventional methods of analysis. We recommend the routine use of MRA to interpret AFM force-indentation measurements for other complex soft materials including mammalian cells, bacteria and nanomaterials. PMID:25569139

  7. Atomic force microscopy measurements of bacterial adhesion and biofilm formation onto clay-sized particles

    Science.gov (United States)

    Huang, Qiaoyun; Wu, Huayong; Cai, Peng; Fein, Jeremy B.; Chen, Wenli

    2015-11-01

    Bacterial adhesion onto mineral surfaces and subsequent biofilm formation play key roles in aggregate stability, mineral weathering, and the fate of contaminants in soils. However, the mechanisms of bacteria-mineral interactions are not fully understood. Atomic force microscopy (AFM) was used to determine the adhesion forces between bacteria and goethite in water and to gain insight into the nanoscale surface morphology of the bacteria-mineral aggregates and biofilms formed on clay-sized minerals. This study yields direct evidence of a range of different association mechanisms between bacteria and minerals. All strains studied adhered predominantly to the edge surfaces of kaolinite rather than to the basal surfaces. Bacteria rarely formed aggregates with montmorillonite, but were more tightly adsorbed onto goethite surfaces. This study reports the first measured interaction force between bacteria and a clay surface, and the approach curves exhibited jump-in events with attractive forces of 97 ± 34 pN between E. coli and goethite. Bond strengthening between them occurred within 4 s to the maximum adhesion forces and energies of -3.0 ± 0.4 nN and -330 ± 43 aJ (10-18 J), respectively. Under the conditions studied, bacteria tended to form more extensive biofilms on minerals under low rather than high nutrient conditions.

  8. Nanoscale spatially resolved simultaneous measurement of in-plane and out-of-plane force components on surfaces: a novel operational mode in atomic force microscopy

    Science.gov (United States)

    Watson, Gregory S.; Dinte, Bradley P.; Blach, Jolanta A.; Myhra, Sverre

    2002-11-01

    The atomic force microscope (AFM) allows investigation of the properties of surfaces and interfaces at atomic scale resolution. However, several different operational modes, (imaging, force versus distance and lateral force modes), need to be deployed in order to gain insight into the structure, tribological and mechanical properties. A new method, based on a variation of the force versus distance mode, has been developed. In essence, a coupling of the deformational modes of the probe is exploited whereby the tip is induced to undergo lateral travel in response to application of an out-of-plane force (and thus normal bending of the force-sensing lever). The lateral travel induces in-plane forces that are then measurable as a consequence of stimulation of the 'buckling' deformational mode of the lever. Due to the lever geometry, the technique offers an increase in resolution of an order of magnitude over existing AFM methods for measurement of atomic scale stick-slip events. In addition, the method allows measurement of the lateral deformation of the sample as well as scanner calibration. Outcomes will be demonstrated for atomically flat surfaces such as WTe2 and highly oriented pyrolytic graphite.

  9. The Use of Atomic Force Microscopy as a Technique for the Identification of Cancerous Cells

    International Nuclear Information System (INIS)

    The monograph presents the use of atomic force microscopy (AFM) as a tool for the identification of cancerous cells by studies of the expression of different types of molecules directly on the surface of living cells. The full quantitative description (that is not accessible by other techniques) performed for a given type of molecular interactions has been obtained by using the following quantities: an unbinding force, probability, rupture length and the effective spring constant taking into account the stiffness of a single complex. All, these parameters were extracted from AFM measurements The analysis of the interaction forces performed by AFM allows the quantitative determination of: i) the static properties of a single molecular complex where its strength of interaction and stiffness of the studied complex can be obtained, ii) dynamic properties, on the basis of which the kinetic properties of the unbinding process can be delivered, and iii) properties of adhesion clusters, where the interrelation between single complexes can be characterized, in particular the mechanism of the unbinding can be obtained. The presented characterization of the interaction force between single molecules demonstrates that atomic force microscopy can be used as exceptional technique to study the expression of molecules on a cell surface. Such measurements are not limited to a typical interactions occurring between single molecules but also it is possible to study the interactions between parts of molecules. The results presented in this monograph point to a novel approach to identify cancer-related changes in a quantitative way what can be used for describing and confirming the pathological state of a single cell. (author)

  10. Characterization of the surface charge distribution on kaolinite particles using high resolution atomic force microscopy

    Science.gov (United States)

    Kumar, Naveen; Zhao, Cunlu; Klaassen, Aram; van den Ende, Dirk; Mugele, Frieder; Siretanu, Igor

    2016-02-01

    Most solid surfaces, in particular clay minerals and rock surfaces, acquire a surface charge upon exposure to an aqueous environment due to adsorption and/or desorption of ionic species. Macroscopic techniques such as titration and electrokinetic measurements are commonly used to determine the surface charge and ζ -potential of these surfaces. However, because of the macroscopic averaging character these techniques cannot do justice to the role of local heterogeneities on the surfaces. In this work, we use dynamic atomic force microscopy (AFM) to determine the distribution of surface charge on the two (gibbsite-like and silica-like) basal planes of kaolinite nanoparticles immersed in aqueous electrolyte with a lateral resolution of approximately 30 nm. The surface charge density is extracted from force-distance curves using DLVO theory in combination with surface complexation modeling. While the gibbsite-like and the silica-like facet display on average positive and negative surface charge values as expected, our measurements reveal lateral variations of more than a factor of two on seemingly atomically smooth terraces, even if high resolution AFM images clearly reveal the atomic lattice on the surface. These results suggest that simple surface complexation models of clays that attribute a unique surface chemistry and hence homogeneous surface charge densities to basal planes may miss important aspects of real clay surfaces.

  11. Casimir-Polder force on a V -type three-level atom near a structure containing left-handed materials

    Science.gov (United States)

    Xu, Jingping; Chang, Shenglong; Yang, Yaping; Al-amri, M.

    2016-01-01

    The Casimir-Polder (CP) force acting on a V -type three-level atom which is initially prepared in two different kinds of superposition states, i.e., subradiant and superradiant states, is investigated. The influence of quantum interference on force evolution due to two-dipole transitions is analyzed in detail. It is found that the orientation of the atomic dipole moment has significant influence on the Casimir-Polder force and consequently its evolution. For the ideal degenerate V -type atom with two parallel dipoles, quantum interference leads to population trapping as well as the cancellation of the CP force when the atom is prepared initially in a subradiant state. However, the result changes when we consider the practical Zeeman V -type atom whose two dipole moments are perpendicular to each other. Since quantum interference in such an atom must occur in an anisotropic environment, it is possible to trap atomic population and enhance the CP force simultaneously by preparing the atom initially in sub-radiant states. In principle, our results can be found in an arbitrary anisotropic environment, and here we describe a structure containing left-handed materials to highlight our findings.

  12. Determination of radiation exposure history of common materials and computer hardware by using atomic (and magnetic force) microscopy

    International Nuclear Information System (INIS)

    Defects produced by ionizing radiation are smaller than a micrometer and are unobservable in an optical microscope. An atomic force microscope was utilized to reveal their counts and structure in common materials like mica, silicon, organic solids, polymers, sugar, quartz, and calcite. A magnetic force microscope has shown the damage of radiation on computer hard disks. The present work shows that exposure to radioactive material leaves a permanent record, which can be read for dosimetric or forensic purposes by using atomic force microcopy on common objects or a magnetic force microscope on magnetic media

  13. High-speed atomic force microscope based on an astigmatic detection system

    International Nuclear Information System (INIS)

    High-speed atomic force microscopy (HS-AFM) enables visualizing dynamic behaviors of biological molecules under physiological conditions at a temporal resolution of 1s or shorter. A small cantilever with a high resonance frequency is crucial in increasing the scan speed. However, detecting mechanical resonances of small cantilevers is technically challenging. In this study, we constructed an atomic force microscope using a digital versatile disc (DVD) pickup head to detect cantilever deflections. In addition, a flexure-guided scanner and a sinusoidal scan method were implemented. In this work, we imaged a grating sample in air by using a regular cantilever and a small cantilever with a resonance frequency of 5.5 MHz. Poor tracking was seen at the scan rate of 50 line/s when a cantilever for regular AFM imaging was used. Using a small cantilever at the scan rate of 100 line/s revealed no significant degradation in the topographic images. The results indicate that a smaller cantilever can achieve a higher scan rate and superior force sensitivity. This work shows the potential for using a DVD pickup head in future HS-AFM technology

  14. Dynamic plowing lithography and 6P thin film growth on graphene investigated by atomic force microscopy

    International Nuclear Information System (INIS)

    Full text: For the design of novel graphene based devices specific modifications and manipulations of graphene are essential. The desired properties might be achieved by selective straining and/or multistacking of graphene. As a model system we investigated the growth morphology of the rodlike para-hexaphenyl (6P) molecule on as prepared and dynamic plowing lithography (DPL) modified graphene. As substrate exfoliated graphene flakes on silicon dioxide (SiO2) were used. The DPL of the graphene was performed by bringing the very hard diamond coated tip of a vibrating atomic force microscopy (AFM) probe into close proximity to the substrate. Depending on the chosen experimental parameters the interaction forces between tip and substrate lead either to a local deformation or even to cutting of the graphene flake. The 6P was deposited by means of hot wall epitaxy at sample temperatures above room temperature. The resulting film morphologies on the unaltered and DPL modified graphene were investigated via atomic force microscopy. While on the SiO2 only 6P islands consisting from upright standing molecules are found there are additional needle like structures exclusively found on the graphene. (author)

  15. 'Sub-atomic' resolution of non-contact atomic force microscope images induced by a heterogeneous tip structure: a density functional theory study

    Energy Technology Data Exchange (ETDEWEB)

    Campbellova, Anna; Klapetek, Petr [Czech Metrology Institute, OkruznI 31, 638 00, Brno (Czech Republic); Ondracek, Martin; JelInek, Pavel [Institute of Physics, Academy of Sciences of the Czech Republic, Cukrovarnicka 10, 162 00 Prague (Czech Republic); Pou, Pablo; Perez, Ruben, E-mail: jelinekp@fzu.cz [Departamento de Fisica Teorica de la Materia Condensada, Universidad Autonoma de Madrid, 28049 Madrid (Spain)

    2011-07-22

    A Si adatom on a Si(111)-(7 x 7) reconstructed surface is a typical atomic feature that can rather easily be imaged by a non-contact atomic force microscope (nc-AFM) and can be thus used to test the atomic resolution of the microscope. Based on our first principles density functional theory (DFT) calculations, we demonstrate that the structure of the termination of the AFM tip plays a decisive role in determining the appearance of the adatom image. We show how the AFM image changes depending on the tip-surface distance and the composition of the atomic apex at the end of the tip. We also demonstrate that contaminated tips may give rise to image patterns displaying so-called 'sub-atomic' features even in the attractive force regime.

  16. On the atomic force microscopy characterization of void evolution in severely plastic deformed pure iron

    Science.gov (United States)

    Forouzanmehr, N.; Nili-Ahmadabadi, N.

    2014-08-01

    Different severe plastic deformation comprise equal channel angular pressing (ECAP), shaped cold rolling and drawing, or combined were applied on pure iron to obtain nano structured grains. The results show the formation of high concentration of excess free volume up to about 4% in the cold rolled and drawn specimens. Emphasis has been placed on atomic force microscopy (AFM) observations as additional characterization tools that complement the information provided by other techniques. Since the surface of the materials can be observed with atomic-scale resolution, the AFM is a powerful technique to study porous materials. The microscopy observations detect voids in the nanocrystalline Fe sample- processed by shaped rolling followed by drawing with applied true strain of 7- from nano to sub-micrometer in size. It seems that the coalescence of nanovoids could lead to the formation of micro-voids in the structure of deformed samples.

  17. Investigation of Self Assembled Monolayers (SAM) Applied on Si(100) Surfaces by Atomic Force Microscopy

    International Nuclear Information System (INIS)

    Miniaturization of analytical instrumentation in a molecular and nanometer level has technologically significant. The fabrication of nanopatterns with high resolution SPM nanolithograpy may be applied on atomically flat surfaces. Self Assembled-Monolayers (SAMs) are well-ordered two dimensional molecular assemblies formed by a strong adsorption of an active surfactant on a solid surface. In this study, SAM organic thin film method is applied on silicon surfaces. We used various cleaning procedures such as chemical cleaning, ion beam treatment, on p-type Si(1OO) surfaces. SAMs films were produced from bipolar amphiphiles, Octadecylamine ODA-HCl, 1,12-diaminododecane (DAD) and n-tridecylamine (TDA) molecules on Si wafers. Contact mode scanning method and roughness analysis on the scan images were utilized on the SAM coated and uncoated surfaces by Atomic Force Microscopy

  18. Hidden momentum in a hydrogen atom and the Lorentz force law

    CERN Document Server

    Filho, J S Oliveira

    2015-01-01

    By using perturbation theory, we show that an hydrogen atom with magnetic moment due to the orbital angular momentum of the electron has hidden momentum in the presence of an external electric field. This means that the atomic electronic cloud has a nonzero linear momentum in its center of mass rest frame due to a relativistic effect. This is completely analogous to the hidden momentum that a classical current loop has in the presence of an external electric field. We discuss that this effect is essential for the validity of the Lorentz force law in quantum systems. We also connect our results to the secular Abraham-Minkowski debate about the momentum of light in material media.

  19. Observation of interstitial loops in He+ irradiated W by conductive atomic force microscopy

    International Nuclear Information System (INIS)

    Polycrystalline tungsten (W) has been irradiated with a low-energy (30–830 eV) He+ beam at the W surface temperature of 523–1073 K up to a fluence of 1.0 × 1025/m2. Measurements by non-destructive conductive atomic force microscopy show the existence of nanometer-sized interstitial loops in He+-implanted layer. The size and distribution of interstitial loops are significantly affected by He+ energy and fluence, and W surface temperature. The distribution of interstitial loops becomes orientated in one certain direction after being irradiated at a relatively high fluence or W surface temperature. The cascading slipping of W atoms along one certain dense-packed face has been proposed to explain the ordered arrangement of interstitial loops at elevated temperature. Analysis indicates that the continuous growth of unstable nanometer-sized interstitial loops can result in the surface exfoliation of W materials

  20. Analysis of Adhesive Characteristics of Asphalt Based on Atomic Force Microscopy and Molecular Dynamics Simulation.

    Science.gov (United States)

    Xu, Meng; Yi, Junyan; Feng, Decheng; Huang, Yudong; Wang, Dongsheng

    2016-05-18

    Asphalt binder is a very important building material in infrastructure construction; it is commonly mixed with mineral aggregate and used to produce asphalt concrete. Owing to the large differences in physical and chemical properties between asphalt and aggregate, adhesive bonds play an important role in determining the performance of asphalt concrete. Although many types of adhesive bonding mechanisms have been proposed to explain the interaction forces between asphalt binder and mineral aggregate, few have been confirmed and characterized. In comparison with chemical interactions, physical adsorption has been considered to play a more important role in adhesive bonding between asphalt and mineral aggregate. In this study, the silicon tip of an atomic force microscope was used to represent silicate minerals in aggregate, and a nanoscale analysis of the characteristics of adhesive bonding between asphalt binder and the silicon tip was conducted via an atomic force microscopy (AFM) test and molecular dynamics (MD) simulations. The results of the measurements and simulations could help in better understanding of the bonding and debonding procedures in asphalt-aggregate mixtures during hot mixing and under traffic loading. MD simulations on a single molecule of a component of asphalt and monocrystalline silicon demonstrate that molecules with a higher atomic density and planar structure, such as three types of asphaltene molecules, can provide greater adhesive strength. However, regarding the real components of asphalt binder, both the MD simulations and AFM test indicate that the colloidal structural behavior of asphalt also has a large influence on the adhesion behavior between asphalt and silicon. A schematic model of the interaction between asphalt and silicon is presented, which can explain the effect of aging on the adhesion behavior of asphalt. PMID:27115043