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Sample records for atomic force microscope

  1. Atomic Force Microscope

    Energy Technology Data Exchange (ETDEWEB)

    Day, R.D.; Russell, P.E.

    1988-12-01

    The Atomic Force Microscope (AFM) is a recently developed instrument that has achieved atomic resolution imaging of both conducting and non- conducting surfaces. Because the AFM is in the early stages of development, and because of the difficulty of building the instrument, it is currently in use in fewer than ten laboratories worldwide. It promises to be a valuable tool for obtaining information about engineering surfaces and aiding the .study of precision fabrication processes. This paper gives an overview of AFM technology and presents plans to build an instrument designed to look at engineering surfaces.

  2. Atomic Force Microscope Operation

    Science.gov (United States)

    2008-01-01

    [figure removed for brevity, see original site] Click on image for animation (large file) This animation is a scientific illustration of the operation of NASA's Phoenix Mars Lander's Atomic Force Microscope, or AFM. The AFM is part of Phoenix's Microscopy, Electrochemistry, and Conductivity Analyzer, or MECA. The AFM is used to image the smallest Martian particles using a very sharp tip at the end of one of eight beams. The beam of the AFM is set into vibration and brought up to the surface of a micromachined silicon substrate. The substrate has etched in it a series of pits, 5 micrometers deep, designed to hold the Martian dust particles. The microscope then maps the shape of particles in three dimensions by scanning them with the tip. At the end of the animation is a 3D representation of the AFM image of a particle that was part of a sample informally called 'Sorceress.' The sample was delivered to the AFM on the 38th Martian day, or sol, of the mission (July 2, 2008). The image shows four round pits, only 5 microns in depth, that were micromachined into the silicon substrate. A Martian particle only one micrometer, or one millionth of a meter, across is held in the upper left pit. The rounded particle shown at the highest magnification ever seen from another world is a particle of the dust that cloaks Mars. Such dust particles color the Martian sky pink, feed storms that regularly envelop the planet and produce Mars' distinctive red soil. The AFM was developed by a Swiss-led consortium, with Imperial College London producing the silicon substrate that holds sampled particles. The Phoenix Mission is led by the University of Arizona, Tucson, on behalf of NASA. Project management of the mission is by NASA's Jet Propulsion Laboratory, Pasadena, Calif. Spacecraft development is by Lockheed Martin Space Systems, Denver.

  3. Coaxial atomic force microscope tweezers

    Science.gov (United States)

    Brown, K. A.; Aguilar, J. A.; Westervelt, R. M.

    2010-03-01

    We demonstrate coaxial atomic force microscope (AFM) tweezers that can trap and place small objects using dielectrophoresis (DEP). An attractive force is generated at the tip of a coaxial AFM probe by applying a radio frequency voltage between the center conductor and a grounded shield; the origin of the force is found to be DEP by measuring the pull-off force versus applied voltage. We show that the coaxial AFM tweezers can perform three-dimensional assembly by picking up a specified silica microsphere, imaging with the microsphere at the end of the tip, and placing it at a target destination.

  4. Coaxial Atomic Force Microscope Tweezers

    CERN Document Server

    Brown, K A; Westervelt, R M

    2010-01-01

    We demonstrate coaxial atomic force microscope (AFM) tweezers that can trap and place small objects using dielectrophoresis (DEP). An attractive force is generated at the tip of a coaxial AFM probe by applying a radio frequency voltage between the center conductor and a grounded shield; the origin of the force is found to be DEP by measuring the pull-off force vs. applied voltage. We show that the coaxial AFM tweezers (CAT) can perform three dimensional assembly by picking up a specified silica microsphere, imaging with the microsphere at the end of the tip, and placing it at a target destination.

  5. Sensing mode atomic force microscope

    Science.gov (United States)

    Hough, Paul V. C.; Wang, Chengpu

    2003-01-01

    An atomic force microscope utilizes a pulse release system and improved method of operation to minimize contact forces between a probe tip affixed to a flexible cantilever and a specimen being measured. The pulse release system includes a magnetic particle affixed proximate the probe tip and an electromagnetic coil. When energized, the electromagnetic coil generates a magnetic field which applies a driving force on the magnetic particle sufficient to overcome adhesive forces exhibited between the probe tip and specimen. The atomic force microscope includes two independently displaceable piezo elements operable along a Z-axis. A controller drives the first Z-axis piezo element to provide a controlled approach between the probe tip and specimen up to a point of contact between the probe tip and specimen. The controller then drives the first Z-axis piezo element to withdraw the cantilever from the specimen. The controller also activates the pulse release system which drives the probe tip away from the specimen during withdrawal. Following withdrawal, the controller adjusts the height of the second Z-axis piezo element to maintain a substantially constant approach distance between successive samples.

  6. Hyperbaric hydrothermal atomic force microscope

    Science.gov (United States)

    Knauss, Kevin G.; Boro, Carl O.; Higgins, Steven R.; Eggleston, Carrick M.

    2002-01-01

    A hyperbaric hydrothermal atomic force microscope (AFM) is provided to image solid surfaces in fluids, either liquid or gas, at pressures greater than normal atmospheric pressure. The sample can be heated and its surface imaged in aqueous solution at temperatures greater than 100.degree. C. with less than 1 nm vertical resolution. A gas pressurized microscope base chamber houses the stepper motor and piezoelectric scanner. A chemically inert, flexible membrane separates this base chamber from the sample cell environment and constrains a high temperature, pressurized liquid or gas in the sample cell while allowing movement of the scanner. The sample cell is designed for continuous flow of liquid or gas through the sample environment.

  7. Atomic Force Microscope Mediated Chromatography

    Science.gov (United States)

    Anderson, Mark S.

    2013-01-01

    The atomic force microscope (AFM) is used to inject a sample, provide shear-driven liquid flow over a functionalized substrate, and detect separated components. This is demonstrated using lipophilic dyes and normal phase chromatography. A significant reduction in both size and separation time scales is achieved with a 25-micron-length column scale, and one-second separation times. The approach has general applications to trace chemical and microfluidic analysis. The AFM is now a common tool for ultra-microscopy and nanotechnology. It has also been demonstrated to provide a number of microfluidic functions necessary for miniaturized chromatography. These include injection of sub-femtoliter samples, fluidic switching, and sheardriven pumping. The AFM probe tip can be used to selectively remove surface layers for subsequent microchemical analysis using infrared and tip-enhanced Raman spectroscopy. With its ability to image individual atoms, the AFM is a remarkably sensitive detector that can be used to detect separated components. These diverse functional components of microfluidic manipulation have been combined in this work to demonstrate AFM mediated chromatography. AFM mediated chromatography uses channel-less, shear-driven pumping. This is demonstrated with a thin, aluminum oxide substrate and a non-polar solvent system to separate a mixture of lipophilic dyes. In conventional chromatographic terms, this is analogous to thin-layer chromatography using normal phase alumina substrate with sheardriven pumping provided by the AFM tip-cantilever mechanism. The AFM detection of separated components is accomplished by exploiting the variation in the localized friction of the separated components. The AFM tip-cantilever provides the mechanism for producing shear-induced flows and rapid pumping. Shear-driven chromatography (SDC) is a relatively new concept that overcomes the speed and miniaturization limitations of conventional liquid chromatography. SDC is based on a

  8. Imaging spectroscopy with the atomic force microscope

    OpenAIRE

    Baselt, David R.; Baldeschwieler, John D.

    1994-01-01

    Force curve imaging spectroscopy involves acquiring a force-distance curve at each pixel of an atomic force microscope image. Processing of the resulting data yields images of sample hardness and tip-sample adhesion. These images resemble Z modulation images and the sum of forward and reverse friction images, respectively, and like them exhibit a number of potentially misleading contrast mechanisms. In particular, XY tip motion has a pronounced effect on hardness images and the meniscus force...

  9. First Atomic Force Microscope Image from Mars

    Science.gov (United States)

    2008-01-01

    This calibration image presents three-dimensional data from the atomic force microscope on NASA's Phoenix Mars Lander, showing surface details of a substrate on the microscope station's sample wheel. It will be used as an aid for interpreting later images that will show shapes of minuscule Martian soil particles. The area imaged by the microscope is 40 microns by 40 microns, small enough to fit on an eyelash. The grooves in this substrate are 14 microns (0.00055 inch) apart, from center to center. The vertical dimension is exaggerated in the image to make surface details more visible. The grooves are 300 nanometers (0.00001 inch) deep. This is the first atomic force microscope image recorded on another planet. It was taken on July 9, 2008, during the 44th Martian day, or sol, of the Phoenix mission since landing. Phoenix's Swiss-made atomic force microscope builds an image of the surface shape of a particle by sensing it with a sharp tip at the end of a spring, all microfabricated out of a silicon wafer. A strain gauge records how far the spring flexes to follow the contour of the surface. It can provide details of soil-particle shapes smaller than one-hundredth the width of a human hair. This is about 20 times smaller than what can be resolved with Phoenix's optical microscope, which has provided much higher-magnification imaging than anything seen on Mars previously. Both microscopes are part of Phoenix's Microscopy, Electrochemistry and Conductivity Analyzer.

  10. Sharp Tips on the Atomic Force Microscope

    Science.gov (United States)

    2008-01-01

    This image shows the eight sharp tips of the NASA's Phoenix Mars Lander's Atomic Force Microscope, or AFM. The AFM is part of Phoenix's Microscopy, Electrochemistry, and Conductivity Analyzer, or MECA. The microscope maps the shape of particles in three dimensions by scanning them with one of the tips at the end of a beam. For the AFM image taken, the tip at the end of the upper right beam was used. The tip pointing up in the enlarged image is the size of a smoke particle at its base, or 2 microns. This image was taken with a scanning electron microscope before Phoenix launched on August 4, 2007. The AFM was developed by a Swiss-led consortium in collaboration with Imperial College London. The Phoenix Mission is led by the University of Arizona, Tucson, on behalf of NASA. Project management of the mission is by NASA's Jet Propulsion Laboratory, Pasadena, Calif. Spacecraft development is by Lockheed Martin Space Systems, Denver.

  11. Measuring Forces between Oxide Surfaces Using the Atomic Force Microscope

    DEFF Research Database (Denmark)

    Pedersen, Henrik Guldberg; Høj, Jakob Weiland

    1996-01-01

    The interactions between colloidal particles play a major role in processing of ceramics, especially in casting processes. With the Atomic Force Microscope (AFM) it is possible to measure the inter-action force between a small oxide particle (a few micron) and a surface as function of surface...

  12. Electrical Analogy to an Atomic Force Microscope

    Directory of Open Access Journals (Sweden)

    O. Kucera

    2010-04-01

    Full Text Available Several applications of the atomic force microscopy (AFM, such as measurement of soft samples, manipulation with molecules, etc., require mechanical analysis of the AFM probe behavior. In this article we suggest the electrical circuit analogy to AFM cantilever tip motion. Well developed circuit theories in connection with fairly accessible software for circuit analysis make this alternative method easy to use for a wide community of AFM users.

  13. Calibrated atomic force microscope measurements of vickers hardness indentations and tip production and characterisation for scanning tunelling microscope

    DEFF Research Database (Denmark)

    Jensen, Carsten P.

    Calibrated atomic force microscope measurements of vickers hardness indentations and tip production and characterisation for scanning tunelling microscope......Calibrated atomic force microscope measurements of vickers hardness indentations and tip production and characterisation for scanning tunelling microscope...

  14. Atomic force microscopic study on lipid bilayer nanoscale phase separation

    OpenAIRE

    Liu, Rui

    2014-01-01

    Phase separation of copolymers or lipid membranes in nanoscale has attracted increasing interests for their applications in the synthesis of inorganic nanomaterial. The nanoscale phase separation of liquid bilayer as a supported membrane is systematically investigated by atomic force microscope (AFM). Moreover, the position of the fluorescence indicator, which is commonly used in the phase separation study in optical microscope, is also probed in this study to complete the knowledge of tradit...

  15. Polymerized LB films imaged with a combined atomic force microscope-fluorescence microscope

    OpenAIRE

    Putman, Constant A.J.; Hansma, Helen G.; Gaub, Hermann E.; Hansma, Paul K.

    1992-01-01

    The first results obtained with a new stand-alone atomic force microscope (AFM) integrated with a standard Zeiss optical fluorescence microscope are presented. The optical microscope allows location and selection of objects to be imaged with the high-resolution AFM. Furthermore, the combined microscope enables a direct comparison between features observed in the fluorescence microscope and those observed in the images obtained with the AFM, in air or under liquid. The cracks in polymerized La...

  16. Polymerized LB films imaged with a combined atomic force microscope-fluorescence microscope

    NARCIS (Netherlands)

    Putman, Constant A.J.; Hansma, Helen G.; Gaub, Hermann E.; Hansma, Paul K.

    1992-01-01

    The first results obtained with a new stand-alone atomic force microscope (AFM) integrated with a standard Zeiss optical fluorescence microscope are presented. The optical microscope allows location and selection of objects to be imaged with the high-resolution AFM. Furthermore, the combined microsc

  17. New approaches to atomic force microscope lithography on silicon

    DEFF Research Database (Denmark)

    Birkelund, Karen; Thomsen, Erik Vilain; Rasmussen, Jan Pihl;

    1997-01-01

    We have investigated new approaches to the formation of conducting nanowires on crystalline silicon surfaces using atomic force microscope (AFM) lithography. To increase processing speed and reduce wear of the AFM tip, large-scale structures are formed with a direct laser write setup, while the AFM...

  18. Fabrication of an all-metal atomic force microscope probe

    DEFF Research Database (Denmark)

    Rasmussen, Jan Pihl; Tang, Peter Torben; Hansen, Ole;

    1997-01-01

    This paper presents a method for fabrication of an all-metal atomic force microscope probe (tip, cantilever and support) for optical read-out, using a combination of silicon micro-machining and electroforming. The paper describes the entire fabrication process for a nickel AFM-probe. In addition...

  19. Quantitative Membrane Electrostatics with the Atomic Force Microscope

    OpenAIRE

    Yang, Yi; Mayer, Kathryn M.; Hafner, Jason H.

    2006-01-01

    The atomic force microscope (AFM) is sensitive to electric double layer interactions in electrolyte solutions, but provides only a qualitative view of interfacial electrostatics. We have fully characterized silicon nitride probe tips and other experimental parameters to allow a quantitative electrostatic analysis by AFM, and we have tested the validity of a simple analytical force expression through numerical simulations. As a test sample, we have measured the effective surface charge density...

  20. Resonant difference-frequency atomic force ultrasonic microscope

    Science.gov (United States)

    Cantrell, John H. (Inventor); Cantrell, Sean A. (Inventor)

    2010-01-01

    A scanning probe microscope and methodology called resonant difference-frequency atomic force ultrasonic microscopy (RDF-AFUM), employs an ultrasonic wave launched from the bottom of a sample while the cantilever of an atomic force microscope, driven at a frequency differing from the ultrasonic frequency by one of the contact resonance frequencies of the cantilever, engages the sample top surface. The nonlinear mixing of the oscillating cantilever and the ultrasonic wave in the region defined by the cantilever tip-sample surface interaction force generates difference-frequency oscillations at the cantilever contact resonance. The resonance-enhanced difference-frequency signals are used to create images of nanoscale near-surface and subsurface features.

  1. Manipulation of cadmium selenide nanorods with an atomic force microscope

    International Nuclear Information System (INIS)

    We have used an atomic force microscope (AFM) to manipulate and study ligand-capped cadmium selenide nanorods deposited on highly oriented pyrolitic graphite (HOPG). The AFM tip was used to manipulate (i.e., translate and rotate) the nanorods by applying a force perpendicular to the nanorod axis. The manipulation result was shown to depend on the point of impact of the AFM tip with the nanorod and whether the nanorod had been manipulated previously. Forces applied parallel to the nanorod axis, however, did not give rise to manipulation. These results are interpreted by considering the atomic-scale interactions of the HOPG substrate with the organic ligands surrounding the nanorods. The vertical deflection of the cantilever was recorded during manipulation and was combined with a model in order to estimate the value of the horizontal force between the tip and nanorod during manipulation. This horizontal force is estimated to be on the order of a few tens of nN.

  2. Edge Effects and Coupling Effects in Atomic Force Microscope Images

    Institute of Scientific and Technical Information of China (English)

    ZHANGXiang-jun; MENGYong-gang; WENShi-zhu

    2004-01-01

    The AFM images were obtained by an atomic force microscope (AFM) and transformed from the deformation of AFM micro cantilever probe. However, due to the surface topography and surface forces applied on the AFM tip of sample, the deformation of AFM probe results in obvious edge effects and coupling effects in the AFM images. The deformation of AFM probe was analyzed,the mechanism of the edge effects and the coupling effects was investigated, and their results in the AFM images were studied. It is demanstrated by the theoretical analysis and AFM experiments that the edge effects make lateral force images more clear than the topography images, also make extraction of frictional force force from lateral force images mare complex and difficult. While the coupling effects make the comparison between topography images and lateral force images mare advantage to acquire precise topography information by AFM.

  3. A Compact Vertical Scanner for Atomic Force Microscopes

    Directory of Open Access Journals (Sweden)

    Jae Hong Park

    2010-11-01

    Full Text Available A compact vertical scanner for an atomic force microscope (AFM is developed. The vertical scanner is designed to have no interference with the optical microscope for viewing the cantilever. The theoretical stiffness and resonance of the scanner are derived and verified via finite element analysis. An optimal design process that maximizes the resonance frequency is performed. To evaluate the scanner’s performance, experiments are performed to evaluate the travel range, resonance frequency, and feedback noise level. In addition, an AFM image using the proposed vertical scanner is generated.

  4. Atomic force microscope observations of otoconia in the newt

    Science.gov (United States)

    Hallworth, R.; Wiederhold, M. L.; Campbell, J. B.; Steyger, P. S.

    1995-01-01

    Calcitic and aragonitic otoconia from the Japanese red-bellied newt, Cynops pyrrhogaster, were examined using an atomic force microscope. The surface structure of both otoconial polymorphs consisted of arrays of elements approximately 50 nm in diameter. Elements were generally round and were separated by shallow depressions of no more than 20 nm. The elements are suggested to be single crystals of calcium carbonate. The relationship of these observations to theories of otoconial genesis is discussed.

  5. Atomic force microscope probe-based nanometric scribing

    International Nuclear Information System (INIS)

    Miniaturization of machine components is recognized by many as a significant technological development for a vast spectrum of products. An atomic force microscope (AFM) probe that can exert forces onto a variety of engineering materials is used to perform mechanical scribing at the nanoscale. The success of nanomechanical machining at such fine scales is based on the understanding of microstructural machining mechanics. This paper investigates the cutting behaviour in the nanoscale of a chromium workpiece by using a retrofitted commercial AFM with an acoustic emission sensor, in order to scratch the surface and measure forces. The calibration procedure for acquiring the forces is discussed. The cutting force model, which incorporates the flow stress and friction coefficient in the nano-scale machining, is also presented

  6. Imaging using lateral bending modes of atomic force microscope cantilevers

    Science.gov (United States)

    Caron, A.; Rabe, U.; Reinstädtler, M.; Turner, J. A.; Arnold, W.

    2004-12-01

    Using scanning probe techniques, surface properties such as shear stiffness and friction can be measured with a resolution in the nanometer range. The torsional deflection or buckling of atomic force microscope cantilevers has previously been used in order to measure the lateral forces acting on the tip. This letter shows that the flexural vibration modes of cantilevers oscillating in their width direction parallel to the sample surface can also be used for imaging. These lateral cantilever modes exhibit vertical deflection amplitudes if the cantilever is asymmetric in thickness direction, e.g., by a trapezoidal cross section.

  7. Direct observation of uncoated spectrin with atomic force microscope

    Institute of Scientific and Technical Information of China (English)

    张平城; 白春礼; 成英俊; 方晔; 冯立明; 潘华珍

    1996-01-01

    Spectrin molecules extracted from human blood ceil membrane have been examined by atomic force microscopy (AFM) without using shadowing or staining procedures. A drop of the solution containing spectrin molecules was deposited on the freshly deaved mica substrate. After about 1 min, the residual solution was removed with a piece of filter paper. Afterwards the sample was imaged with a home-made atomic force microscope (AFM) in air in a constant force mode. The obtained AFM images revealed that the spectrin molecules prepared from the above procedures exhibit several kinds of structures as follows: (i) the compact rod-like spectrin heterodimers with a length of around 100 nm; (ii) bent or curved linear tetramers with a length of around 200 nm; (iii) somewhat curved spectrin hexamers, octomers or decamers with lengths of about 300, 400, or 500 nm; and (iv) high oligomers with a length above 1 000 nm.

  8. Diagonal control design for atomic force microscope piezoelectric tube nanopositioners.

    Science.gov (United States)

    Bhikkaji, B; Yong, Y K; Mahmood, I A; Moheimani, S O R

    2013-02-01

    Atomic Force Microscopes (AFM) are used for generating surface topography of samples at micro to atomic resolutions. Many commercial AFMs use piezoelectric tube nanopositioners for scanning. Scanning rates of these microscopes are hampered by the presence of low frequency resonant modes. When inadvertently excited, these modes lead to high amplitude mechanical vibrations causing the loss of accuracy, while scanning, and eventually to break down of the tube. Feedback control has been used to damp these resonant modes. Thereby, enabling higher scanning rates. Here, a multivariable controller is designed to damp the first resonant mode along both the x and y axis. Exploiting the inherent symmetry in the piezoelectric tube, the multivariable control design problem is recast as independent single-input single-output (SISO) designs. This in conjunction with integral resonant control is used for damping the first resonant mode. PMID:23464216

  9. Nanoindentation of gold nanorods with an atomic force microscope

    Science.gov (United States)

    Reischl, B.; Kuronen, A.; Nordlund, K.

    2014-12-01

    The atomic force microscope (AFM) can be used to measure mechanical properties of nanoscale objects, which are too small to be studied using a conventional nanoindenter. The contact mechanics at such small scales, in proximity of free surfaces, deviate substantially from simple continuum models. We present results from atomistic computer simulations of the indentation of gold nanorods using a diamond AFM tip and give insight in the atomic scale processes, involving creation and migration of dislocations, leading to the plastic deformation of the sample under load, and explain the force-distance curves observed for different tip apex radii of curvature, as well as different crystallographic structure and orientation of the gold nanorod samples.

  10. MIDAS: Lessons learned from the first spaceborne atomic force microscope

    CERN Document Server

    Bentley, Mark S; Butler, Bart; Gavira, Jose; Jeszenszky, Harald; Mannel, Thurid; Romstedt, Jens; Schmied, Roland; Torkar, Klaus

    2016-01-01

    The Micro-Imaging Dust Analysis System (MIDAS) atomic force microscope (AFM) onboard the Rosetta orbiter was the first such instrument launched into space in 2004. Designed only a few years after the technique was invented, MIDAS is currently orbiting comet 67P Churyumov-Gerasimenko and producing the highest resolution 3D images of cometary dust ever made in situ. After more than a year of continuous operation much experience has been gained with this novel instrument. Coupled with operations of the Flight Spare and advances in terrestrial AFM a set of "lessons learned" has been produced, cumulating in recommendations for future spaceborne atomic force microscopes. The majority of the design could be reused as-is, or with incremental upgrades to include more modern components (e.g. the processor). Key additional recommendations are to incorporate an optical microscope to aid the search for particles and image registration, to include a variety of cantilevers (with different spring constants) and a variety of ...

  11. MIDAS: Lessons learned from the first spaceborne atomic force microscope

    Science.gov (United States)

    Bentley, Mark Stephen; Arends, Herman; Butler, Bart; Gavira, Jose; Jeszenszky, Harald; Mannel, Thurid; Romstedt, Jens; Schmied, Roland; Torkar, Klaus

    2016-08-01

    The Micro-Imaging Dust Analysis System (MIDAS) atomic force microscope (AFM) onboard the Rosetta orbiter was the first such instrument launched into space in 2004. Designed only a few years after the technique was invented, MIDAS is currently orbiting comet 67P Churyumov-Gerasimenko and producing the highest resolution 3D images of cometary dust ever made in situ. After more than a year of continuous operation much experience has been gained with this novel instrument. Coupled with operations of the Flight Spare and advances in terrestrial AFM a set of "lessons learned" has been produced, cumulating in recommendations for future spaceborne atomic force microscopes. The majority of the design could be reused as-is, or with incremental upgrades to include more modern components (e.g. the processor). Key additional recommendations are to incorporate an optical microscope to aid the search for particles and image registration, to include a variety of cantilevers (with different spring constants) and a variety of tip geometries.

  12. Scanned-cantilever atomic force microscope with large scanning range

    Institute of Scientific and Technical Information of China (English)

    Jintao Yang; Wendong Xu

    2006-01-01

    A scanned-cantilever atomic force microscope (AFM) with large scanning range is proposed, which adopts a new design named laser spot tracking. The scanned-cantilever AFM uses the separate flexure x-y scanner and z scanner instead of the conventional piezoelectric tube scanner. The closed-loop control and integrated capacitive sensors of these scanners can insure that the images of samples have excellent linearity and stability. According to the experimental results, the scanned-cantilever AFM can realize maximal 100 × 100 (μm) scanning range, and 1-nm resolution in z direction, which can meet the requirements of large scale sample testing.

  13. Nonlinear control techniques for an atomic force microscope system

    Institute of Scientific and Technical Information of China (English)

    Yongchun FANG; Matthew FEEMSTER; Darren DAWSON; Nader M.JALILI

    2005-01-01

    Two nonlinear control techniques are proposed for an atomic force microscope system.Initially,a learning-based control algorithm is developed for the microcantilever-sample system that achieves asymptotic cantilever tip tracking for periodic trajectories.Specifically,the control approach utilizes a learning-based feedforward term to compensate for periodic dynamics and high-gain terms to account for non-periodic dynamics.An adaptive control algorithm is then developed to achieve asymptotic cantilever tip tracking for bounded tip trajectories despite uncertainty throughout the system parameters.Simulation results are provided to illustrate the efficacy and performance of the control strategies.

  14. Atomic force microscope characterization of a resonating nanocantilever

    DEFF Research Database (Denmark)

    Abadal, G.; Davis, Zachary James; Borrise, X.;

    2003-01-01

    An atomic force microscope (AFM) is used as a nanometer-scale resolution tool for the characterization of the electromechanical behaviour of a resonant cantilever-based mass sensor. The cantilever is actuated electrostatically by applying DC and AC voltages from a driver electrode placed closely ...... and of the oscillation amplitude on the frequency of the AC voltage is measured by this technique and the results are fitted by a simple non-linear electromechanical model. (C) 2003 Elsevier Science B.V. All rights reserved....

  15. An atomic force microscope tip as a light source

    OpenAIRE

    Lulevich, V.; Honig, Christopher D. F.; Ducker, William A.

    2005-01-01

    We present a simple method for causing the end of a silicon nitride atomic force microscope (AFM) tip to emit light, and we use this emitted light to perform scanning near-field optical microscopy. Illumination of a silicon nitride AFM tip by blue (488 nm) or green (532 nm) laser light causes the sharp part of the tip to emit orange light. Orange light is emitted when the tip is immersed in either air or water; and while under illumination, emission continues for a period of many hours withou...

  16. Thermal writing using a heated atomic force microscope tip

    Science.gov (United States)

    Mamin, H. J.

    1996-07-01

    Resistive heating of an atomic force microscope tip was used to perform thermally induced surface modifications. Heating was achieved by dissipating power in the legs of an electrically conducting silicon cantilever. Temperatures of up to 170 °C were obtained using 40 mW of input power. Electrical measurements used to monitor the temperature showed thermal time constants of 0.35-0.45 ms, depending on whether the tip was in contact with a substrate. The heated tip was used to demonstrate thermomechanical writing on a polycarbonate substrate, as well as thermal writing of an optical phase change material.

  17. Interlaboratory comparison of traceable atomic force microscope pitch measurements

    Science.gov (United States)

    Dixson, Ronald; Chernoff, Donald A.; Wang, Shihua; Vorburger, Theodore V.; Tan, Siew Leng; Orji, Ndubuisi G.; Fu, Joseph

    2010-06-01

    The National Institute of Standards and Technology (NIST), Advanced Surface Microscopy (ASM), and the National Metrology Centre (NMC) of the Agency for Science, Technology, and Research (A*STAR) in Singapore have completed a three-way interlaboratory comparison of traceable pitch measurements using atomic force microscopy (AFM). The specimen being used for this comparison is provided by ASM and consists of SiO2 lines having a 70 nm pitch patterned on a silicon substrate. NIST has a multifaceted program in atomic force microscope (AFM) dimensional metrology. One component of this effort is a custom in-house metrology AFM, called the calibrated AFM (C-AFM). The NIST C-AFM has displacement metrology for all three axes traceable to the 633 nm wavelength of the iodine-stabilized He-Ne laser - a recommended wavelength for realization of the SI (Système International d'Unités, or International System of Units) meter. NIST used the C-AFM to participate in this comparison. ASM used a commercially available AFM with an open-loop scanner, calibrated by a 144 nm pitch transfer standard. In a prior collaboration with Physikalisch-Technische Bundesanstalt (PTB), the German national metrology institute, ASM's transfer standard was calibrated using PTB's traceable optical diffractometry instrument. Thus, ASM's measurements are also traceable to the SI meter. NMC/A*STAR used a large scanning range metrological atomic force microscope (LRM-AFM). The LRM-AFM integrates an AFM scanning head into a nano-stage equipped with three built-in He-Ne laser interferometers so that its measurement related to the motion on all three axes is directly traceable to the SI meter. The measurements for this interlaboratory comparison have been completed and the results are in agreement within their expanded uncertainties and at the level of a few parts in 104.

  18. Study of adhesive forces on a silicon nanotip by atomic force microscope in contact mode

    Science.gov (United States)

    Agache, Vincent; Legrand, Bernard; Collard, Dominique; Buchaillot, Lionel

    2002-04-01

    Atomic Force Microscope operating in contact mode is used in this paper for probing the spatial distribution of adhesive forces versus the topography of a silicon nanotip. This nanotip consists in an ultra sha4rp silicon tip with radius less than 15 nm fabricated using a combination of high- resolution electron beam lithography and plasma dry etching. The amplitude of the forces is determined from force versus distance curve measurements. Hence, by determining the contact point and the pull-off force from the force curves, the surface topography and the adhesive forces are simultaneously obtained at various locations on the surface. This paper reports both measurements and the modeling of adhesive forces versus the contact point on the nanotip. As the nanotip is sharper and has got a smaller aperture angle than the employed Atomic Force Microscope tip, the measurements are focused on the nanotip apex.

  19. Adhesive forces investigation on a silicon tip by contact-mode atomic force microscope

    Science.gov (United States)

    Agache, Vincent; Legrand, Bernard; Collard, Dominique; Buchaillot, Lionel

    2002-09-01

    An atomic force microscope operating in contact mode is used in this letter for probing the adhesive forces at the apex of a silicon nanotip with typical radius smaller than 15 nm, fabricated using a combination of high-resolution electron beam lithography and plasma dry etching. The amplitude of the forces is deduced from force versus distance curve measurements. By determining the contact point and the pull-off force from the force curves, the surface topography and the adhesive forces are simultaneously obtained at various locations on the surface. This letter reports both measurements and modeling of adhesive forces versus the contact point on the nanotip. As the nanotip is sharper and has a smaller aperture angle than the employed atomic force microscope tip, the measurements are focused on the nanotip apex.

  20. Atomic force microscope chamber for in situ studies of ice

    Science.gov (United States)

    Zepeda, Salvador; Yeh, Yin; Orme, Christine A.

    2001-11-01

    To investigate the surface morphologies of biological systems in a controlled gaseous environment (e.g., the temperature, humidity and composition), most commercial atomic force microscopes require modification. We have designed a double-jacketed environmental chamber specifically for a Nanoscope IIIa (Digital Instruments, Santa Barbara, CA) force microscope. We use cold nitrogen and thermoelectric devices to control the temperature in the chamber; the nitrogen simultaneously serves to create an inert environment. We have also designed a temperature controlled sample stage utilizing thermoelectric devices for fine temperature regulation. A variation of this sample stage allows us to image samples in fluids at cold temperatures with an O-ringless configuration. The relative humidity within the chamber is also measured with commercially available relative humidity sensors. We investigate the surface morphology of ice Ih in its pure phase and shall extend the study to ice in the presence of biological molecules, such as antifreeze proteins. We present a detailed description of our design and our first images of polycrystalline ice and single crystals of ice grown in situ from the vapor.

  1. A subsurface add-on for standard atomic force microscopes

    Energy Technology Data Exchange (ETDEWEB)

    Verbiest, G. J., E-mail: Verbiest@physik.rwth-aachen.de [JARA-FIT and II. Institute of Physics, RWTH Aachen University, 52074 Aachen (Germany); Zalm, D. J. van der; Oosterkamp, T. H.; Rost, M. J., E-mail: Rost@physics.leidenuniv.nl [Kamerlingh Onnes Laboratory, Leiden University, P.O. Box 9504, 2300 RA Leiden (Netherlands)

    2015-03-15

    The application of ultrasound in an Atomic Force Microscope (AFM) gives access to subsurface information. However, no commercially AFM exists that is equipped with this technique. The main problems are the electronic crosstalk in the AFM setup and the insufficiently strong excitation of the cantilever at ultrasonic (MHz) frequencies. In this paper, we describe the development of an add-on that provides a solution to these problems by using a special piezo element with a lowest resonance frequency of 2.5 MHz and by separating the electronic connection for this high frequency piezo element from all other connections. In this sense, we support researches with the possibility to perform subsurface measurements with their existing AFMs and hopefully pave also the way for the development of a commercial AFM that is capable of imaging subsurface features with nanometer resolution.

  2. Mathematical modeling of nanomachining with atomic force microscope cantilevers

    International Nuclear Information System (INIS)

    This article theoretically analyzes the cutting depth and material removal rate of an atomic force microscope (AFM) cantilever during nanomachining. An analytical expression for the vibration frequency and displacement of the cantilever has been obtained by using the modified couple stress theory. The theory includes one additional material length scale parameter revealing the micro-scale effect. According to the analysis, the results show that the effect of size-dependent on the vibration behavior of the AFM cantilever is obvious. The maximum displacement of nanomachining with the AFM cantilever represents the cutting depth. The area under the displacement-time curve is related to the material removal rate. When the excitation frequency is closer to the nature frequency of the cantilever, a larger material removal rate is obtained

  3. Nanodot deposition and its application with atomic force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Liu Zenglei, E-mail: liuzenglei@sia.cn; Jiao Niandong, E-mail: ndjiao@sia.cn [Chinese Academy of Sciences, State Key Laboratory of Robotics, Shenyang Institute of Automation (China); Xu Ke [Shenyang Jianzhu University (China); Wang, Zhidong [Chiba Institute of Technology (Japan); Dong Zaili; Liu Lianqing [Chinese Academy of Sciences, State Key Laboratory of Robotics, Shenyang Institute of Automation (China)

    2013-06-15

    Nanodot deposition using atomic force microscope (AFM) is investigated. To realize repeatable and precise deposition of nanodots, the detailed control method is discussed. The electric field between AFM tip and substrate is analyzed, and a convenient method to control tip-substrate separation is proposed. In experiments, two nanodot matrixes are fabricated and the heights of the nanodots are analyzed. Experimental results testify that the control method can lead to repeatable and precise fabrication of deposited nanodots. As an application of deposited nanodots, a carbon nanotube (CNT) is soldered on gold electrodes with deposited Au nanodots. After soldering, the contact resistances between the CNT and the electrodes decrease greatly. AFM-based nanodot deposition can be used to fabricate special nanopatterns; also it can be used to solder nanomaterials on substrates to improve the electrical connection, which has a promising future for nanodevice fabrication.

  4. A Conceptual Atomic Force Microscope using LEGO for Nanoscience Education

    Directory of Open Access Journals (Sweden)

    Tsung-Han Hsieh

    2014-05-01

    Full Text Available A lack of effective educational materials is limited general public awareness of, and interest in, nanoscience. This paper presents a conceptual atomic force microscope (AFM model built by using the LEGO® MINDSTORMS series. AFMs are perhaps one of the most fundamental and widely-used instruments in nanoscience and nanotechnology, thus the introduction of this LEGO® AFM should be beneficial to nanoscience education. Programmed in LabVIEW, this LEGO® model has the ability to scan the samples and construct a three-dimensional (3D surface graphs of the sample, based on the mechanism used for AFM. With this LEGO® AFM, the students can directly access nanoscience concepts through hands-on experience constructing an AFM model. This interaction will lead to a better understanding of nanoscience principles, and motivate learners to further explore both the theoretical and experimental aspects of the domain.

  5. A new ion sensing deep atomic force microscope

    Science.gov (United States)

    Drake, Barney; Randall, Connor; Bridges, Daniel; Hansma, Paul K.

    2014-08-01

    Here we describe a new deep atomic force microscope (AFM) capable of ion sensing. A novel probe assembly incorporates a micropipette that can be used both for sensing ion currents and as the tip for AFM imaging. The key advance of this instrument over previous ion sensing AFMs is that it uses conventional micropipettes in a novel suspension system. This paper focuses on sensing the ion current passively while using force feedback for the operation of the AFM in contact mode. Two images are obtained simultaneously: (1) an AFM topography image and (2) an ion current image. As an example, two images of a MEMS device with a microchannel show peaks in the ion current as the pipette tip goes over the edges of the channel. This ion sensing AFM can also be used in other modes including tapping mode with force feedback as well as in non-contact mode by utilizing the ion current for feedback, as in scanning ion conductance microscopy. The instrument is gentle enough to be used on some biological samples such as plant leaves.

  6. A new ion sensing deep atomic force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Drake, Barney; Randall, Connor; Bridges, Daniel; Hansma, Paul K. [Department of Physics, University of California, Santa Barbara, California 93106 (United States)

    2014-08-15

    Here we describe a new deep atomic force microscope (AFM) capable of ion sensing. A novel probe assembly incorporates a micropipette that can be used both for sensing ion currents and as the tip for AFM imaging. The key advance of this instrument over previous ion sensing AFMs is that it uses conventional micropipettes in a novel suspension system. This paper focuses on sensing the ion current passively while using force feedback for the operation of the AFM in contact mode. Two images are obtained simultaneously: (1) an AFM topography image and (2) an ion current image. As an example, two images of a MEMS device with a microchannel show peaks in the ion current as the pipette tip goes over the edges of the channel. This ion sensing AFM can also be used in other modes including tapping mode with force feedback as well as in non-contact mode by utilizing the ion current for feedback, as in scanning ion conductance microscopy. The instrument is gentle enough to be used on some biological samples such as plant leaves.

  7. The atomic force microscope as a mechano–electrochemical pen

    Directory of Open Access Journals (Sweden)

    Christian Obermair

    2011-10-01

    Full Text Available We demonstrate a method that allows the controlled writing of metallic patterns on the nanometer scale using the tip of an atomic force microscope (AFM as a “mechano–electrochemical pen”. In contrast to previous experiments, no voltage is applied between the AFM tip and the sample surface. Instead, a passivated sample surface is activated locally due to lateral forces between the AFM tip and the sample surface. In this way, the area of tip–sample interaction is narrowly limited by the mechanical contact between tip and sample, and well-defined metallic patterns can be written reproducibly. Nanoscale structures and lines of copper were deposited, and the line widths ranged between 5 nm and 80 nm, depending on the deposition parameters. A procedure for the sequential writing of metallic nanostructures is introduced, based on the understanding of the passivation process. The mechanism of this mechano–electrochemical writing technique is investigated, and the processes of site-selective surface depassivation, deposition, dissolution and repassivation of electrochemically deposited nanoscale metallic islands are studied in detail.

  8. Athermalization in atomic force microscope based force spectroscopy using matched microstructure coupling

    OpenAIRE

    Torun, H.; Finkler, O.; Degertekin, F. L.

    2009-01-01

    The authors describe a method for athermalization in atomic force microscope (AFM) based force spectroscopy applications using microstructures that thermomechanically match the AFM probes. The method uses a setup where the AFM probe is coupled with the matched structure and the displacements of both structures are read out simultaneously. The matched structure displaces with the AFM probe as temperature changes, thus the force applied to the sample can be kept constant without the need for a ...

  9. Manipulation and Graphene local oxidation lithography using an Atomic Force Microscope

    International Nuclear Information System (INIS)

    in this work, SPM nano lithography in Atomic Force Microscope mode was used to etching and manipulate graphene films on a nanoscopic length scale in order to produce electronic nano structures. By means of local anodic oxidation with an Atomic Force Microscope which is an electrochemical process applying voltage between Atomic Force Microscope probe and graphene surface, we are able to structure isolating trenches into single-layer and few-layer graphene flakes. Trench sizes of less than 30 nm in width are attainable with this technique. Besides oxidation, the influence of mechanical peeling and scratching with an Atomic Force Microscope of few layer graphene sheets was investigated.

  10. Experimental Investigation of the Velocity Effect on Adhesion Forces with an Atomic Force Microscope

    Institute of Scientific and Technical Information of China (English)

    魏征; 赵亚溥

    2004-01-01

    Capillary forces are significantly dominant in adhesive forces measured with an atomic force microscope (AFM)in ambient air, which are always thought to be dependent on water film thickness, relative humidity, and the free energy of water film. We study the nature of the pull-off force on a variety of surfaces as a function of tip velocity.It is found that the capillary forces are of relatively strong dependence on tip velocity. The present experiment is expected to provide a better understanding of the work mechanism of AFM in ambient air.

  11. z calibration of the atomic force microscope by means of a pyramidal tip

    DEFF Research Database (Denmark)

    Jensen, Flemming

    1993-01-01

    A new method for imaging the probe tip of an atomic force microscope cantilever by the atomic force microscope itself (self-imaging) is presented. The self-imaging is accomplished by scanning the probe tip across a sharper tip on the surface. By using a pyramidal probe tip with a very well...

  12. Contact resonances of U-shaped atomic force microscope probes

    Energy Technology Data Exchange (ETDEWEB)

    Rezaei, E.; Turner, J. A., E-mail: jaturner@unl.edu [Mechanical and Materials Engineering, University of Nebraska-Lincoln, W342 Nebraska Hall, Lincoln, Nebraska 68588 (United States)

    2016-01-21

    Recent approaches used to characterize the elastic or viscoelastic properties of materials with nanoscale resolution have focused on the contact resonances of atomic force microscope (CR-AFM) probes. The experiments for these CR-AFM methods involve measurement of several contact resonances from which the resonant frequency and peak width are found. The contact resonance values are then compared with the noncontact values in order for the sample properties to be evaluated. The data analysis requires vibration models associated with the probe during contact in order for the beam response to be deconvolved from the measured spectra. To date, the majority of CR-AFM research has used rectangular probes that have a relatively simple vibration response. Recently, U-shaped AFM probes have created much interest because they allow local sample heating. However, the vibration response of these probes is much more complex such that CR-AFM is still in its infancy. In this article, a simplified analytical model of U-shaped probes is evaluated for contact resonance applications relative to a more complex finite element (FE) computational model. The tip-sample contact is modeled using three orthogonal Kelvin-Voigt elements such that the resonant frequency and peak width of each mode are functions of the contact conditions. For the purely elastic case, the frequency results of the simple model are within 8% of the FE model for the lowest six modes over a wide range of contact stiffness values. Results for the viscoelastic contact problem for which the quality factor of the lowest six modes is compared show agreement to within 13%. These results suggest that this simple model can be used effectively to evaluate CR-AFM experimental results during AFM scanning such that quantitative mapping of viscoelastic properties may be possible using U-shaped probes.

  13. Contact resonances of U-shaped atomic force microscope probes

    International Nuclear Information System (INIS)

    Recent approaches used to characterize the elastic or viscoelastic properties of materials with nanoscale resolution have focused on the contact resonances of atomic force microscope (CR-AFM) probes. The experiments for these CR-AFM methods involve measurement of several contact resonances from which the resonant frequency and peak width are found. The contact resonance values are then compared with the noncontact values in order for the sample properties to be evaluated. The data analysis requires vibration models associated with the probe during contact in order for the beam response to be deconvolved from the measured spectra. To date, the majority of CR-AFM research has used rectangular probes that have a relatively simple vibration response. Recently, U-shaped AFM probes have created much interest because they allow local sample heating. However, the vibration response of these probes is much more complex such that CR-AFM is still in its infancy. In this article, a simplified analytical model of U-shaped probes is evaluated for contact resonance applications relative to a more complex finite element (FE) computational model. The tip-sample contact is modeled using three orthogonal Kelvin-Voigt elements such that the resonant frequency and peak width of each mode are functions of the contact conditions. For the purely elastic case, the frequency results of the simple model are within 8% of the FE model for the lowest six modes over a wide range of contact stiffness values. Results for the viscoelastic contact problem for which the quality factor of the lowest six modes is compared show agreement to within 13%. These results suggest that this simple model can be used effectively to evaluate CR-AFM experimental results during AFM scanning such that quantitative mapping of viscoelastic properties may be possible using U-shaped probes

  14. Influence of atomic force microscope (AFM) probe shape on adhesion force measured in humidity environment

    Institute of Scientific and Technical Information of China (English)

    阳丽; 涂育松; 谭惠丽

    2014-01-01

    In micro-manipulation, the adhesion force has very important influence on behaviors of micro-objects. Here, a theoretical study on the effects of humidity on the adhesion force is presented between atomic force microscope (AFM) tips and substrate. The analysis shows that the precise tip geometry plays a critical role on humidity depen-dence of the adhesion force, which is the dominant factor in manipulating micro-objects in AFM experiments. For a blunt (paraboloid) tip, the adhesion force versus humidity curves tends to the apparent contrast (peak-to-valley corrugation) with a broad range. This paper demonstrates that the abrupt change of the adhesion force has high correla-tion with probe curvatures, which is mediated by coordinates of solid-liquid-vapor contact lines (triple point) on the probe profiles. The study provides insights for further under-standing nanoscale adhesion forces and the way to choose probe shapes in manipulating micro-objects in AFM experiments.

  15. Theoretical Study on the Capillary Force between an Atomic Force Microscope Tip and a Nanoparticle

    Institute of Scientific and Technical Information of China (English)

    LI Zhao-Xia; ZHANG Li-Juan; YI Hou-Hui; FANG Hai-Ping

    2007-01-01

    @@ Considering that capillary force is one of the most important forces between nanoparticles and atomic force microscope (AFM) tips in ambient atmosphere, we develop an analytic approach on the capillary force between an AFM tip and a nanoparticle. The results show that the capillary forces are considerably affected by the geometry of the AFM tip, the humidity of the environment, the vertical distance between the AFM tip and the nanoparticle, as well as the contact angles of the meniscus with an AFM tip and a nanoparticle. It is found that the sharper the AFM tip, the smaller the capillary force. The analyses and results are expected to be helpful for the quantitative imaging and manipulating of nanoparticles by AFMs.

  16. Investigation of penetration force of living cell using an atomic force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Kwon, Eun Young; Kim, Young Tae; Kim, Dae Eun [Yonsei University, Seoul (Korea, Republic of)

    2009-07-15

    Recently, the manipulation of a single cell has been receiving much attention in transgenesis, in-vitro fertilization, individual cell based diagnosis, and pharmaceutical applications. As these techniques require precise injection and manipulation of cells, issues related to penetration force arise. In this work the penetration force of living cell was studied using an atomic force microscope (AFM). L929, HeLa, 4T1, and TA3 HA II cells were used for the experiments. The results showed that the penetration force was in the range of 2{approx}22 nN. It was also found that location of cell penetration and stiffness of the AFM cantilever affected the penetration force significantly. Furthermore, double penetration events could be detected, due to the multi-membrane layers of the cell. The findings of this work are expected to aid in the development of precision micro-medical instruments for cell manipulation and treatment

  17. Atomic force microscope study of three-dimensional nanostructure sidewalls

    Energy Technology Data Exchange (ETDEWEB)

    Hussain, Muhammad Mustafa [SEMATECH, 2706 Montopolis Drive, Austin, TX 78741 (United States); Gondran, Carolyn F H [Advanced Technology Development Facility, 2706 Montopolis Drive, Austin, TX 78741 (United States); Michelson, Diane K [International SEMATECH Manufacturing Initiative, 2706 Montopolis Drive, Austin, TX 78741 (United States)

    2007-08-22

    Next generation planar and non-planar complementary metal oxide semiconductor (CMOS) structures are three-dimensional nanostructures with multi-layer stacks that can contain films thinner than ten atomic layers. The high resolution of transmission electron microscopy (TEM) is typically chosen for studying properties of these stacks such as film thickness, interface and interfacial roughness. However, TEM sample preparation is time-consuming and destructive, and TEM analysis is expensive and can provide problematic results for surface and interface roughness. Therefore, in this paper, we present the use of direct measurements of sidewall surface structures by conventional atomic force microscopy (AFM) as an alternative or complementary method for studying multi-layer film stacks and as the preferred method for studying FinFET sidewall surface roughness. In addition to these semiconductor device applications, this AFM sidewall measurement technique could be used for other three-dimensional nanostructures.

  18. A comparison of dynamic atomic force microscope set-ups for performing atomic scale manipulation experiments

    International Nuclear Information System (INIS)

    We present the results of calculations performed to investigate the process of single-atom manipulation with the non-contact atomic force microscope comparing the two most common experimental set-ups: a conventional large amplitude silicon cantilever and a small amplitude quartz tuning fork. The manipulation of a model system-an oxygen vacancy in the MgO(001) surface by a single vertical approach at a fixed lateral position-is simulated for each set-up using a detailed and realistic atomistic model that accounts for temperature and the tip trajectory, and it is found that both approaches produce the manipulation event in approximately the same way. The behaviour of the tip dynamics and the resulting response of the instrumentation to the manipulation event is studied using a virtual dynamic atomic force microscope that includes a realistic description of noise for each type of set-up. The results of these calculations indicate how a single-atom manipulation can be performed and recognized by each type of experiment

  19. Development of Atomic Force Microscope for Arthroscopic Knee Cartilage Inspection

    Science.gov (United States)

    Imer, Raphaël; Akiyama, Terunobu; de Rooij, Nicolaas F.; Stolz, Martin; Aebi, Ueli; Friederich, Niklaus F.; Koenig, Uwe; Wirz, Dieter; Daniels, A. U.; Staufer, Urs

    2006-03-01

    A recent study, based on ex vivo unconfined compression testing of normal, diseased, and enzymatically altered cartilage, revealed that a scanning force microscope (SFM), used as a nano-intender, is sensitive enough to enable measurement of alterations in the biomechanical properties of cartilage. Based on these ex vivo measurements, we have designed a quantitative diagnosis tool, the scanning force arthroscope (SFA), able to perform in vivo measurements during a standard arthroscopic procedure. For stabilizing and positioning the instrument relative to the surface under investigation, a pneumatic system has been developed. A segmented piezoelectric tube was used to perform the indentation displacement, and a pyramidal nanometer-scale silicon tip mounted on a cantilever with an integrated deflection sensor measured the biomechanical properties of cartilage. Mechanical means were designed to protect the fragile cantilever during the insertion of the instrument into the knee joint. The stability of the pneumatic stage was checked with a prototype SFA. In a series of tests, load-displacement curves were recorded in a knee phantom and, more recently, in a pig’s leg.

  20. Visualization of Cytoskeletal Elements by the Atomic Force Microscope

    CERN Document Server

    Berdyyeva, T; Sokolov, I

    2004-01-01

    We describe a novel application of atomic force microscopy (AFM) to directly visualize cytoskeletal fibers in human foreskin epithelial cells. The nonionic detergent Triton X-100 in a low concentration was used to remove the membrane, soluble proteins, and organelles from the cell. The remaining cytoskeleton can then be directly visualized in either liquid or air-dried ambient conditions. These two types of scanning provide complimentary information. Scanning in liquid visualizes the surface filaments of the cytoskeleton, whereas scanning in air shows both the surface filaments and the total "volume" of the cytoskeletal fibers. The smallest fibers observed were ca. 50 nm in diameter. The lateral resolution of this technique was ca.20 nm, which can be increased to a single nanometer level by choosing sharper AFM tips. Because the AFM is a true three dimensional technique, we are able to quantify the observed cytoskeleton by its density and volume. The types of fibers can be identified by their size, similar to...

  1. A Cost-Effective Atomic Force Microscope for Undergraduate Control Laboratories

    Science.gov (United States)

    Jones, C. N.; Goncalves, J.

    2010-01-01

    This paper presents a simple, cost-effective and robust atomic force microscope (AFM), which has been purposely designed and built for use as a teaching aid in undergraduate controls labs. The guiding design principle is to have all components be open and visible to the students, so the inner functioning of the microscope has been made clear to…

  2. Scratch direction and threshold force in nanoscale scratching using atomic force microscopes

    Science.gov (United States)

    Tseng, Ampere A.; Kuo, Chung-Feng Jeffrey; Jou, Shyankay; Nishimura, Shinya; Shirakashi, Jun-ichi

    2011-09-01

    The nanoscaled tip in an AFM (atomic force microscope) has become an effective scratching tool for material removing in nanofabrication. In this article, the characteristics of using a diamond-coated pyramidal tip to scratch Ni-Fe thin film surfaces was experimentally investigated with the focus on the evaluation of the influence of the scratch or scan direction on the final shape of the scratched geometry as well as the applied scratch force. Results indicated that both the scratched profile and the scratch force were greatly affected by the scratch direction. It has been found that, to minimize the formation of protuberances along the groove sides and to have a better control of the scratched geometry, the tip face should be perpendicular to the scratching direction, which is also known as orthogonal cutting condition. To demonstrate the present findings, three groove patterns have been scratched with the tip face perpendicular to the scratching direction and very little amount of protuberances was observed. The threshold scratch force was also predicted based on the Hertz contact theory. Without considering the surface friction and adhesive forces between the tip and substrate, the threshold force predicted was twice smaller than the measurement value. Finally, recommendations for technical improvement and research focuses are provided.

  3. Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope.

    Science.gov (United States)

    Hagedorn, Till; El Ouali, Mehdi; Paul, William; Oliver, David; Miyahara, Yoichi; Grütter, Peter

    2011-11-01

    A modification of the common electrochemical etching setup is presented. The described method reproducibly yields sharp tungsten tips for usage in the scanning tunneling microscope and tuning fork atomic force microscope. In situ treatment under ultrahigh vacuum (p ≤10(-10) mbar) conditions for cleaning and fine sharpening with minimal blunting is described. The structure of the microscopic apex of these tips is atomically resolved with field ion microscopy and cross checked with field emission.

  4. Investigation of structural change of purple membrane in storage by transmission electron microscope and atomic force microscope

    Institute of Scientific and Technical Information of China (English)

    2001-01-01

    The structural change of purple membrane during storage has been investigated by means of transmission electron microscope and atomic force microscope. It is found that many liposomes have spontaneously evolved from the purple membrane sheets isolated three years ago. The membrane proteins on the liposomes, bacteriorhodopsin, are still presented as trimers in 2-D hexagonal structure, which is the same as that in natural cell membrane. However, the cytoplasmic surface of purple membrane faced outside on the liposomes.

  5. Novel parallel plate condenser for single particle electrostatic force measurements in atomic force microscope

    KAUST Repository

    Kwek, Jin Wang

    2011-07-01

    A combination of small parallel plate condenser with Indium Tin Oxide (ITO) glass slides as electrodes and an atomic force microscope (AFM) is used to characterize the electrostatic behavior of single glass bead microparticles (105-150 μm) glued to the AFM cantilever. This novel setup allows measurements of the electrostatic forces acting on a particle in an applied electrical field to be performed in ambient air conditions. By varying the position of the microparticle between the electrodes and the strength of the applied electric field, the relative contributions of the particle net charge, induced and image charges were investigated. When the microparticle is positioned in the middle of the electrodes, the force acting on the microparticle was linear with the applied electric field and proportional to the microparticle net charge. At distances close to the bottom electrode, the force follows a parabolic relationship with the applied electric field reflecting the contributions of induced and image charges. The method can be used for the rapid evaluation of the charging and polarizability properties of the microparticle as well as an alternative to the conventional Faraday\\'s pail technique. © 2011 Elsevier B.V.

  6. Modelling atomic scale manipulation with the non-contact atomic force microscope

    International Nuclear Information System (INIS)

    We present the results of calculations performed to model the process of lateral manipulation of an oxygen vacancy in the MgO(001) surface using the non-contact atomic force microscope (NC-AFM). The potential energy surfaces for the manipulation as a function of tip position are determined from atomistic modelling of the MgO(001) surface interacting with a Mg terminated MgO tip. These energies are then used to model the dynamical evolution of the system as the tip oscillates and at a finite temperature using a kinetic Monte Carlo method. The manipulation process is strongly dependent on the lateral position of the tip and the system temperature. It is also found that the expectation value of the point at which the vacancy jumps depends on the trajectory of the oscillating cantilever as the surface is approached. The effect of the manipulation on the operation of the NC-AFM is modelled with a virtual dynamic AFM, which explicitly simulates the entire experimental instrumentation and control loops. We show how measurable experimental signals can result from a single controlled atomic scale event and suggest the most favourable conditions for achieving successful atomic scale manipulation experimentally

  7. Quantitative comparison of two independent lateral force calibration techniques for the atomic force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Barkley, Sarice S.; Cannara, Rachel J. [Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States); Deng Zhao [Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States); Maryland NanoCenter, University of Maryland, College Park, Maryland 20742 (United States); Gates, Richard S.; Reitsma, Mark G. [Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States)

    2012-02-15

    Two independent lateral-force calibration methods for the atomic force microscope (AFM)--the hammerhead (HH) technique and the diamagnetic lateral force calibrator (D-LFC)--are systematically compared and found to agree to within 5% or less, but with precision limited to about 15%, using four different tee-shaped HH reference probes. The limitations of each method, both of which offer independent yet feasible paths toward traceable accuracy, are discussed and investigated. We find that stiff cantilevers may produce inconsistent D-LFC values through the application of excessively high normal loads. In addition, D-LFC results vary when the method is implemented using different modes of AFM feedback control, constant height and constant force modes, where the latter is more consistent with the HH method and closer to typical experimental conditions. Specifically, for the D-LFC apparatus used here, calibration in constant height mode introduced errors up to 14 %. In constant force mode using a relatively stiff cantilever, we observed an {approx_equal} 4 % systematic error per {mu}N of applied load for loads {<=} 1 {mu}N. The issue of excessive load typically emerges for cantilevers whose flexural spring constant is large compared with the normal spring constant of the D-LFC setup (such that relatively small cantilever flexural displacements produce relatively large loads). Overall, the HH method carries a larger uncertainty, which is dominated by uncertainty in measurement of the flexural spring constant of the HH cantilever as well as in the effective length dimension of the cantilever probe. The D-LFC method relies on fewer parameters and thus has fewer uncertainties associated with it. We thus show that it is the preferred method of the two, as long as care is taken to perform the calibration in constant force mode with low applied loads.

  8. Higher Harmonics Generation in Tapping Mode Atomic Force Microscope

    Institute of Scientific and Technical Information of China (English)

    LI Yuan; QIAN Jian-Qiang

    2009-01-01

    The contribution of higher harmonics to the movement of a micro rectangular cantilever in tapping mode AFM is investigated. The dependence between the phase lag of the higher harmonic components and tip-sample separation are found to be an order of magnitude higher than the base one, reflecting an increasing sensitivity to local variations of surface properties compared to the normal phase signal.The strong correlation between the higher harmonic amplitude and average sample deformation implies that the higher harmonic amplitude can be taken to monitor the tapping force or as feedback variable to fulfill a constant repulsive force mode.

  9. Massively Parallel Atomic Force Microscope with Digital Holographic Readout

    International Nuclear Information System (INIS)

    Massively Parallel Scanning Probe Microscopy is an obvious path for data storage (E Grochowski, R F Hoyt, Future Trends in Hard disc Drives, IEEE Trans. Magn. 1996, 32, 1850- 1854; J L Griffin, S W Schlosser, G R Ganger and D F Nagle, Modeling and Performance of MEMS-Based Storage Devices, Proc. ACM SIGMETRICS, 2000). Current experimental systems still lay far behind Hard Disc Drive (HDD) or Digital Video Disk (DVD), be it in access speed, data throughput, storage density or cost per bit. This paper presents an entirely new approach with the promise to break several of these barriers. The key idea is readout of a Scanning Probes Microscope (SPM) array by Digital Holographic Microscopy (DHM). This technology directly gives phase information at each pixel of a CCD array. This means that no contact line to each individual SPM probes is needed. The data is directly available in parallel form. Moreover, the optical setup needs in principle no expensive components, optical (or, to a large extent, mechanical) imperfections being compensated in the signal processing, i.e. in electronics. This gives the system the potential for a low cost device with fast Terabit readout capability

  10. Serum induced degradation of 3D DNA box origami observed by high speed atomic force microscope

    DEFF Research Database (Denmark)

    Jiang, Zaixing; Zhang, Shuai; Yang, Chuanxu;

    2015-01-01

    DNA box origami in serum using high-speed atomic force microscope optimized for imaging 3D DNA origami in real time. The time resolution allows characterizing the stages of serum effects on individual 3D DNA box origami with nanometer resolution. Our results indicate that the whole digest process...

  11. A Computer-Controlled Classroom Model of an Atomic Force Microscope

    Science.gov (United States)

    Engstrom, Tyler A.; Johnson, Matthew M.; Eklund, Peter C.; Russin, Timothy J.

    2015-01-01

    The concept of "seeing by feeling" as a way to circumvent limitations on sight is universal on the macroscopic scale--reading Braille, feeling one's way around a dark room, etc. The development of the atomic force microscope (AFM) in 1986 extended this concept to imaging in the nanoscale. While there are classroom demonstrations that use…

  12. Atomic force microscope with combined FTIR-Raman spectroscopy having a micro thermal analyzer

    Science.gov (United States)

    Fink, Samuel D.; Fondeur, Fernando F.

    2011-10-18

    An atomic force microscope is provided that includes a micro thermal analyzer with a tip. The micro thermal analyzer is configured for obtaining topographical data from a sample. A raman spectrometer is included and is configured for use in obtaining chemical data from the sample.

  13. Nano Goes to School: A Teaching Model of the Atomic Force Microscope

    Science.gov (United States)

    Planinsic, Gorazd; Kovac, Janez

    2008-01-01

    The paper describes a teaching model of the atomic force microscope (AFM), which proved to be successful in the role of an introduction to nanoscience in high school. The model can demonstrate the two modes of operation of the AFM (contact mode and oscillating mode) as well as some basic principles that limit the resolution of the method. It can…

  14. Development of novel and sensitive sensors based on microcantilever of atomic force microscope

    Institute of Scientific and Technical Information of China (English)

    JIN Yan; WANG Kemin; JIN Rong

    2006-01-01

    Recently, the development of sensors based on microfabricated cantilevers of atomic force microscope (AFM) has attracted considerable attention from the designers of novel physical, chemical, and biological sensors. Many kinds of sensors have been developed taking the advantages of its high-resolution imaging, force measurement and force sensitivity, such as immunosensor and DNA biosensor and the sensors for detection of intermolecular interaction. This paper reviews the progress made in this field and discusses the signal transfer principles by which the design of the sensors is achieved.

  15. Atomic Force Microscope Studies of the Fusion of Floating Lipid Bilayers

    OpenAIRE

    Abdulreda, Midhat H.; Moy, Vincent T.

    2007-01-01

    This study investigated the fusion of apposing floating bilayers of egg L-α-phosphatidylcholine (egg PC) or 1,2-dimyristoyl-sn-glycero-3-phosphocholine. Atomic force microscope measurements of fusion forces under different compression rates were acquired to reveal the energy landscape of the fusion process under varied lipid composition and temperature. Between compression rates of ∼1000 and ∼100,000 pN/s, applied forces in the range from ∼100 to ∼500 pN resulted in fusion of floating bilayer...

  16. Surface Electromechanical Coupling on DLC Film with Conductive Atomic Force Microscope

    Institute of Scientific and Technical Information of China (English)

    朱守星; 丁建宁; 范真; 李长生; 蔡兰; 杨继昌

    2004-01-01

    Diamond-like carbon (DLC) film composed of microscopically insulation but microscopically a mixture of conducting (sp2) and insulating (spa) phases was discussed on the local modification with a conductive atomic force microscope (C-AFM). Especially, a topographic change was observed when a direct current (DC) bias-voltage was applied to the DLC film. Experimental results show that a nanoscale pit on DLC surface was formed when applying a positive 25 V on DLC film. According to the interacting force between CoCr-coated microelectronic scanning probe (MESP) tip and DLC surface, as well as the Sondheimer oscillation theory, the "scalewing effect" of the pit was explained. Electromechanical coupling on DLC film suggested that the depth of pits increased with an increase of load applied to surface when the cantilever-deflected signal was less than a certain threshold voltage.

  17. A Study on HA Titanium Surface with Atomic Force Microscope (AFM)

    Institute of Scientific and Technical Information of China (English)

    2005-01-01

    Three kinds of titanium surface especially the HA surface are analyzed. Titanium was treated by 3 kinds of methods that were acid & alkali, calcic solution and apatite solution. Samples were observed by optic microscope and atomic force microscope ( AFM). The typical surface morphology of the acid and alkali group is little holes, and on the two HA surface the tiny protuberances is typical. The surface treated by apatite solution was smoother than the two formers. The rough surface treated with acid and alkali was propitious to Ca + , Pand proteins' adhesion, and the relatively smooth HA surface was of benefit to the cell adhesion.

  18. A direct micropipette-based calibration method for atomic force microscope cantilevers

    OpenAIRE

    Liu, Baoyu; Yu, Yan; Yao, Da-Kang; Shao, Jin-Yu

    2009-01-01

    In this report, we describe a direct method for calibrating atomic force microscope (AFM) cantilevers with the micropipette aspiration technique (MAT). A closely fitting polystyrene bead inside a micropipette is driven by precisely controlled hydrostatic pressures to apply known loads on the sharp tip of AFM cantilevers, thus providing a calibration at the most functionally relevant position. The new method is capable of calibrating cantilevers with spring constants ranging from 0.01 to hundr...

  19. Visualization of Cellulose Microfibrils of Phyllostachys pubescens Fibers with Atomic Force Microscope

    Institute of Scientific and Technical Information of China (English)

    2008-01-01

    Atomic force microscope(AFM) was used to investigate the arrangement of cellulose microfibrils (CMF) in Moso bamboo (Phyllostachys pubescens) fibers. Two methods of sample preparation were used here for different purposes. The first method was chemical maceration with a mixture of hydrogen peroxide and glacial acetic acid, through which the obtained fibers were suitable for observing the orientation of CMF in the primary wal1. The other method was to prepare tangential microtomed sections with a thickness o...

  20. Effect of hydration film on scanning images of atomic force microscope

    Institute of Scientific and Technical Information of China (English)

    2006-01-01

    A standard calibration grating was used for image scanning to investigate the effect of hydration films on imaging resolution by Atomic Force Microscope (AFM). The results showed that the hydration films greatly affect the imaging resolution for the tapping mode, but no evident effect on the contact mode. The possible reasons for the effect of hydration films on scanning images of AFM are also brought forward here.

  1. Intermittent contact interaction between an atomic force microscope cantilever and a nanowire

    Science.gov (United States)

    Knittel, I.; Ungewitter, L.; Hartmann, U.

    2012-05-01

    We investigate in theory and experiment the intermittent contact interaction between an atomic force microscope (AFM) cantilever and a nanowire under ambient conditions. The nanowire is modeled as a spring reacting instantaneously to any change of the force between the wire and the cantilever. This implies that the cantilever is subject to an "effective" force-distance relation, containing not only the surface forces but also the deflection of the nanowire. Experimentally, CVD-grown tin oxide nanowires and lithographically structured silicon nanowire arrays were investigated by intermittent contact AFM. By comparison of experimental and simulated distance-dependent resonance curves it is found that the nanowires behave like "fast nanosprings" and that the adhesion force is one of the key factors determining distance-dependent resonance curves. The results are fully applicable to a scenario in which a cantilever equipped by a nanowire interacts with a surface.

  2. Probing molecular interaction between transferrin and anti-transferrin by atomic force microscope

    Institute of Scientific and Technical Information of China (English)

    2006-01-01

    The interaction between transferrin (Tf) and its antibody was investigated by atomic force microscope. Tf-antibody was immobilized on the Au-coated glass slide, and the specific combination between antibody and antigen was also characterized by AFM. The results showed that holo-transferrin was jogged with anti-transferrin, and binded anti-tran- sferrin more tightly than apo-transferrin. The force- distance curves revealed that the affinity of anti-trans- ferrin and holo-transferrin was much stronger than that of apo-transferrin.

  3. Surface features on Sahara soil dust particles made visible by atomic force microscope (AFM phase images

    Directory of Open Access Journals (Sweden)

    M. O. Andreae

    2008-10-01

    Full Text Available We show that atomic force microscopy (AFM phase images can reveal surface features of soil dust particles, which are not evident using other microscopic methods. The non-contact AFM method is able to resolve topographical structures in the nanometer range as well as to uncover repulsive atomic forces and attractive van der Waals' forces, and thus gives insight to surface properties. Though the method does not allow quantitative assignment in terms of chemical compound description, it clearly shows deposits of distinguishable material on the surface. We apply this technique to dust aerosol particles from the Sahara collected over the Atlantic Ocean and describe micro-features on the surfaces of such particles.

  4. Surface features on Sahara soil dust particles made visible by atomic force microscope (AFM phase images

    Directory of Open Access Journals (Sweden)

    G. Helas

    2008-08-01

    Full Text Available We show that atomic force microscopy (AFM phase images can reveal surface features of soil dust particles, which are not evident using other microscopic methods. The non-contact AFM method is able to resolve topographical structures in the nanometer range as well as to uncover repulsive atomic forces and attractive van der Waals' forces, and thus gives insight to surface properties. Though the method does not allow quantitative assignment in terms of chemical compound description, it clearly shows deposits of distinguishable material on the surface. We apply this technique to dust aerosol particles from the Sahara collected over the Atlantic Ocean and describe micro-features on the surfaces of such particles.

  5. Development of nanomanipulator using a high-speed atomic force microscope coupled with a haptic device

    Energy Technology Data Exchange (ETDEWEB)

    Iwata, F., E-mail: tmfiwat@ipc.shizuoka.ac.jp [Faculty of Engineering, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8561 (Japan); Research Institute of Electronics, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8011 (Japan); Ohashi, Y.; Ishisaki, I. [Faculty of Engineering, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8561 (Japan); Picco, L.M. [H Will Physics Laboratory and IRC in Nanotechnology, University of Bristol, Tyndall Avenue, Bristol BS8 1TL (United Kingdom); Ushiki, T. [Graduate School of Medical and Dental Sciences, Niigata University, Asahimachidori, Niigata, 951-8122 (Japan)

    2013-10-15

    The atomic force microscope (AFM) has been widely used for surface fabrication and manipulation. However, nanomanipulation using a conventional AFM is inefficient because of the sequential nature of the scan-manipulation scan cycle, which makes it difficult for the operator to observe the region of interest and perform the manipulation simultaneously. In this paper, a nanomanipulation technique using a high-speed atomic force microscope (HS-AFM) is described. During manipulation using the AFM probe, the operation is periodically interrupted for a fraction of a second for high-speed imaging that allows the topographical image of the manipulated surface to be periodically updated. With the use of high-speed imaging, the interrupting time for imaging can be greatly reduced, and as a result, the operator almost does not notice the blink time of the interruption for imaging during the manipulation. This creates a more intuitive interface with greater feedback and finesse to the operator. Nanofabrication under real-time monitoring was performed to demonstrate the utility of this arrangement for real-time nanomanipulation of sample surfaces under ambient conditions. Furthermore, the HS-AFM is coupled with a haptic device for the human interface, enabling the operator to move the HS-AFM probe to any position on the surface while feeling the response from the surface during the manipulation. - Highlights: • A nanomanipulater based on a high-speed atomic force microscope was developped. • High-speed imaging provides a valuable feedback during the manipulation operation. • Operator can feel the response from the surface via a haptic device during manipulation. • Nanofabrications under real-time monitoring were successfully performed.

  6. Tribological characteristics of ZnO nanowires investigated by atomic force microscope

    Science.gov (United States)

    Chung, Koo-Hyun; Kim, Hyun-Joon; Lin, Li-Yu; Kim, Dae-Eun

    2008-08-01

    Zinc oxide (ZnO) nanowires have attracted great interest in nanodevices. In this work, the tribological characteristics of vertically grown ZnO nanowires obtained by metalorganic chemical vapor deposition were investigated by using an atomic force microscope (AFM). The ZnO nanowires were slid against flattened silicon and diamond-coated AFM probes under 50 150 nN normal force while monitoring the frictional force. The wear of the ZnO nanowires was observed by a scanning electron microscope and quantified based on Archard’s wear law. Also, the wear debris accumulated on the silicon probe was analyzed by using a transmission electron microscope (TEM). The results showed that the wear of ZnO nanowires slid against the silicon probe was extremely small. However, when the ZnO nanowires were slid against the diamond-coated probe, the wear coefficients ranged from 0.006 to 0.162, which correspond to the range of severe wear at the macroscale. It was also shown that the friction coefficient decreased from 0.30 to 0.25 as the sliding cycles increased. From TEM observation, it was found that the ZnO wear debris was mainly amorphous in structure. Also, crystalline ZnO nanoparticles were observed among the wear debris.

  7. Observation on Surface and Cross Section of Thin Film Solar Cells Using Atomic Force Microscope

    Institute of Scientific and Technical Information of China (English)

    FENG Liang-huan; WU Li-li; CAI Wei; CAI Ya-ping; ZHENG Jia-gui; ZHANG Jing-quan; LI Bing; LI Wei

    2005-01-01

    Atomic force microscope (AFM) is able to produce three-dimensional digital data in both forcemode and height-mode and its applications are not limited to map the surfaces of conducting materials. It can use the force-mode to image the repulsive and attractive force patterns. The cross sections of polycrystalline CdS/CdTe and amorphous silicon heterojunction solar cells are observed with AFM. In case of short circuit,the microstructures of different layers in the samples are clearly displayed. When the cells are open circuit, the topographical images are altered, the potential outline due to the space charge in junction region is observed.Obviously, AFM can be employed to investigate experimentally built-in potential in junction of semiconductor devices, such as solar cells.

  8. A virtual instrument to standardise the calibration of atomic force microscope cantilevers

    CERN Document Server

    Sader, John E; Gibson, Christopher T; Haviland, David B; Higgins, Michael J; Kilpatrick, Jason I; Lu, Jianing; Mulvaney, Paul; Shearer, Cameron J; Slattery, Ashley D; Thorén, Per-Anders; Tran, Jim; Zhang, Heyou; Zhang, Hongrui; Zheng, Tian

    2016-01-01

    Atomic force microscope (AFM) users often calibrate the spring constants of cantilevers using functionality built into individual instruments. This is performed without reference to a global standard, which hinders robust comparison of force measurements reported by different laboratories. In this article, we describe a virtual instrument (an internet-based initiative) whereby users from all laboratories can instantly and quantitatively compare their calibration measurements to those of others - standardising AFM force measurements - and simultaneously enabling non-invasive calibration of AFM cantilevers of any geometry. This global calibration initiative requires no additional instrumentation or data processing on the part of the user. It utilises a single website where users upload currently available data. A proof-of-principle demonstration of this initiative is presented using measured data from five independent laboratories across three countries, which also allows for an assessment of current calibratio...

  9. Track sensitivity and the surface roughness measurements of CR-39 with atomic force microscope

    CERN Document Server

    Yasuda, N; Amemiya, K; Takahashi, H; Kyan, A; Ogura, K

    1999-01-01

    Atomic Force Microscope (AFM) has been applied to evaluate the surface roughness and the track sensitivity of CR-39 track detector. We experimentally confirmed the inverse correlation between the track sensitivity and the roughness of the detector surface after etching. The surface of CR-39 (CR-39 doped with antioxidant (HARZLAS (TD-1)) and copolymer of CR-39/NIPAAm (TNF-1)) with high sensitivity becomes rough by the etching, while the pure CR-39 (BARYOTRAK) with low sensitivity keeps its original surface clarity even for the long etching.

  10. Reliable measurement of elastic modulus of cells by nanoindentation in an atomic force microscope

    KAUST Repository

    Zhou, Zhoulong

    2012-04-01

    The elastic modulus of an oral cancer cell line UM1 is investigated by nanoindentation in an atomic force microscope with a flat-ended tip. The commonly used Hertzian method gives apparent elastic modulus which increases with the loading rate, indicating strong effects of viscoelasticity. On the contrary, a rate-jump method developed for viscoelastic materials gives elastic modulus values which are independent of the rate-jump magnitude. The results show that the rate-jump method can be used as a standard protocol for measuring elastic stiffness of living cells, since the measured values are intrinsic properties of the cells. © 2011 Elsevier Ltd.

  11. Aligning DNA on Si surface and cutting off by tips of atomic force microscope

    Institute of Scientific and Technical Information of China (English)

    2003-01-01

    DNA is a kind of promising molecule as nano-lead to build or connect nano-devices due to its stable linear structure and certain conductivity. Many methods have been applied to constructing nano-patterns by using DNA molecule. In this report it is presented that (-DNA was aligned on Si substrate by using the free-flowing method and then imaged by an atomic force microscope (AFM). After the second liquid flow, a catenary-like pattern and a crossed network of -DNA were formed. In addition, the aligned (-DNA was successfully cut off by tips of AFM.

  12. Visualization of interaction between ribosome-inactivating proteins and supercoiled DNA with an atomic force microscope

    Institute of Scientific and Technical Information of China (English)

    吴晓华; 刘望夷; 欧阳振乾; 李民乾

    1997-01-01

    The interaction between ribosome-inactivating proteins (RIPs) and supercoiled DNA was observed with an atomic force microscope (AFM). It was found that RIPs can bind to both supercoiled DNA and the unwound double stranded loop region in supercoiled DNA. The RIPs hound to the supercoils can induce the conformational change of supercoiled DNA. Furthermore, the supercoiled DNA was relaxed and cleaved into nick or linear form by RIPs. It indicated that RIP seemed to be a supercoil-dependent DNA binding protein and exhibited the activity of su-percoil-dependent DNA endonuclease.

  13. Combined laser and atomic force microscope lithography on aluminum: Mask fabrication for nanoelectromechanical systems

    DEFF Research Database (Denmark)

    Berini, Abadal Gabriel; Boisen, Anja; Davis, Zachary James;

    1999-01-01

    A direct-write laser system and an atomic force microscope (AFM) are combined to modify thin layers of aluminum on an oxidized silicon substrate, in order to fabricate conducting and robust etch masks with submicron features. These masks are very well suited for the production of nanoelectromecha......A direct-write laser system and an atomic force microscope (AFM) are combined to modify thin layers of aluminum on an oxidized silicon substrate, in order to fabricate conducting and robust etch masks with submicron features. These masks are very well suited for the production...... of nanoelectromechanical systems (NEMS) by reactive ion etching. In particular, the laser-modified areas can be subsequently locally oxidized by AFM and the oxidized regions can be selectively removed by chemical etching. This provides a straightforward means to define the overall conducting structure of a device by laser...... writing, and to perform submicron modifications by AFM oxidation. The mask fabrication for a nanoscale suspended resonator bridge is used to illustrate the advantages of this combined technique for NEMS. (C) 1999 American Institute of Physics. [S0003-6951(99)00221-1]....

  14. Cellular level nanomanipulation using atomic force microscope aided with superresolution imaging

    Science.gov (United States)

    Chacko, Jenu Varghese; Harke, Benjamin; Canale, Claudio; Diaspro, Alberto

    2014-10-01

    Atomic force microscopes (AFM) provide topographical and mechanical information of the sample with very good axial resolution, but are limited in terms of chemical specificity and operation time-scale. An optical microscope coupled to an AFM can recognize and target an area of interest using specific identification markers like fluorescence tags. A high resolution fluorescence microscope can visualize fluorescence structures or molecules below the classical optical diffraction limit and reach nanometer scale resolution. A stimulated emission depletion (STED) microscopy superresolution (SR) microscope coupled to an AFM is an example in which the AFM tip gains nanoscale manipulation capabilities. The SR targeting and visualization ability help in fast and specific identification of subdiffraction-sized cellular structures and manoeuvring the AFM tip onto the target. We demonstrate how to build a STED AFM and use it for biological nanomanipulation aided with fast visualization. The STED AFM based bionanomanipulation is presented for the first time in this article. This study points to future nanosurgeries performable at single-cell level and a physical targeted manipulation of cellular features as it is currently used in research domains like nanomedicine and nanorobotics.

  15. Modular apparatus for electrostatic actuation of common atomic force microscope cantilevers

    Energy Technology Data Exchange (ETDEWEB)

    Long, Christian J., E-mail: christian.long@nist.gov [Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States); Maryland Nanocenter, University of Maryland, College Park, Maryland 20742 (United States); Cannara, Rachel J. [Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States)

    2015-07-15

    Piezoelectric actuation of atomic force microscope (AFM) cantilevers often suffers from spurious mechanical resonances in the loop between the signal driving the cantilever and the actual tip motion. These spurious resonances can reduce the accuracy of AFM measurements and in some cases completely obscure the cantilever response. To address these limitations, we developed a specialized AFM cantilever holder for electrostatic actuation of AFM cantilevers. The holder contains electrical contacts for the AFM cantilever chip, as well as an electrode (or electrodes) that may be precisely positioned with respect to the back of the cantilever. By controlling the voltages on the AFM cantilever and the actuation electrode(s), an electrostatic force is applied directly to the cantilever, providing a near-ideal transfer function from drive signal to tip motion. We demonstrate both static and dynamic actuations, achieved through the application of direct current and alternating current voltage schemes, respectively. As an example application, we explore contact resonance atomic force microscopy, which is a technique for measuring the mechanical properties of surfaces on the sub-micron length scale. Using multiple electrodes, we also show that the torsional resonances of the AFM cantilever may be excited electrostatically, opening the door for advanced dynamic lateral force measurements with improved accuracy and precision.

  16. Quantitative measurements of electromechanical response with a combined optical beam and interferometric atomic force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Labuda, Aleksander; Proksch, Roger [Asylum Research an Oxford Instruments Company, Santa Barbara, California 93117 (United States)

    2015-06-22

    An ongoing challenge in atomic force microscope (AFM) experiments is the quantitative measurement of cantilever motion. The vast majority of AFMs use the optical beam deflection (OBD) method to infer the deflection of the cantilever. The OBD method is easy to implement, has impressive noise performance, and tends to be mechanically robust. However, it represents an indirect measurement of the cantilever displacement, since it is fundamentally an angular rather than a displacement measurement. Here, we demonstrate a metrological AFM that combines an OBD sensor with a laser Doppler vibrometer (LDV) to enable accurate measurements of the cantilever velocity and displacement. The OBD/LDV AFM allows a host of quantitative measurements to be performed, including in-situ measurements of cantilever oscillation modes in piezoresponse force microscopy. As an example application, we demonstrate how this instrument can be used for accurate quantification of piezoelectric sensitivity—a longstanding goal in the electromechanical community.

  17. Biophysical Measurements of Cells, Microtubules, and DNA with an Atomic Force Microscope

    CERN Document Server

    Devenica, Luka M; Cabrejo, Raysa; Kurek, Matthew; Deveney, Edward F; Carter, Ashley R

    2015-01-01

    Atomic force microscopes (AFMs) are ubiquitous in research laboratories and have recently been priced for use in teaching laboratories. Here we review several AFM platforms (Dimension 3000 by Digital Instruments, EasyScan2 by Nanosurf, ezAFM by Nanomagnetics, and TKAFM by Thorlabs) and describe various biophysical experiments that could be done in the teaching laboratory using these instruments. In particular, we focus on experiments that image biological materials and quantify biophysical parameters: 1) imaging cells to determine membrane tension, 2) imaging microtubules to determine their persistence length, 3) imaging the random walk of DNA molecules to determine their contour length, and 4) imaging stretched DNA molecules to measure the tensional force.

  18. Imaging and Manipulating Molecules on a Zeolite Surface with an Atomic Force Microscope

    Science.gov (United States)

    Weisenhorn, A. L.; Mac Dougall, J. E.; Gould, S. A. C.; Cox, S. D.; Wise, W. S.; Massie, J.; Maivald, P.; Elings, V. B.; Stucky, G. D.; Hansma, P. K.

    1990-03-01

    The adsorption of neutral molecules and ions on the surfaces of zeolites was observed in real time with an atomic force microscope (AFM). Direct imaging of the surface of the zeolite clinoptilolite was possible by using a diluted tert-butyl ammonium chloride solution as a medium. Images of the crystal in different liquids revealed that molecules could be bound to the surface in different ways; neutral molecules of tert-butanol formed an ordered array, whereas tert-butyl ammonium ions formed clusters. These absorbed molecules were not rearranged by the AFM tip when used in an imaging mode. However, when a sufficiently large force was applied, the tip of the AFM could rearrange the tert-butyl ammonium ions on the zeolite surface. This demonstration of molecular manipulation suggests new applications, including biosensors and lithography.

  19. A versatile atomic force microscope for three-dimensional nanomanipulation and nanoassembly

    International Nuclear Information System (INIS)

    A conventional atomic force microscope (AFM) has been successfully applied to manipulating nanoparticles (zero-dimensional), nanowires (one-dimensional) or nanotubes (one- or two-dimensional) by widely used pushing or pulling operations on a single surface. However, pick-and-place nanomanipulation in air is still a challenge. In this research, a modified AFM, called a three-dimensional (3D) manipulation force microscope (3DMFM), was developed to realize 3D nanomanipulation in air. This system consists of two individually actuated cantilevers with protruding tips that are facing each other, constructing a nanotweezer for the pick-and-place nanomanipulation. Before manipulation, one of the cantilevers is employed to position nano-objects and locate the tip of the other cantilever by image scanning. During the manipulation, these two cantilevers work collaboratively as a nanotweezer to grasp, transport and place the nano-objects with real-time force sensing. The manipulation capabilities of the nanotweezer were demonstrated by grabbing and manipulating silicon nanowires to build 3D nanowire crosses. 3D nanomanipulation and nanoassembly performed in air could become feasible through this newly developed 3DMFM.

  20. A versatile atomic force microscope for three-dimensional nanomanipulation and nanoassembly

    Energy Technology Data Exchange (ETDEWEB)

    Xie Hui; Haliyo, Dogan Sinan; Regnier, Stephane [Institut des Systemes Intelligents et de Robotique, Universite Pierre et Marie Curie/CNRS UMR7222, BC 173, 4 Place Jussieu, F-75005 Paris (France)], E-mail: xie@robot.jussieu.fr

    2009-05-27

    A conventional atomic force microscope (AFM) has been successfully applied to manipulating nanoparticles (zero-dimensional), nanowires (one-dimensional) or nanotubes (one- or two-dimensional) by widely used pushing or pulling operations on a single surface. However, pick-and-place nanomanipulation in air is still a challenge. In this research, a modified AFM, called a three-dimensional (3D) manipulation force microscope (3DMFM), was developed to realize 3D nanomanipulation in air. This system consists of two individually actuated cantilevers with protruding tips that are facing each other, constructing a nanotweezer for the pick-and-place nanomanipulation. Before manipulation, one of the cantilevers is employed to position nano-objects and locate the tip of the other cantilever by image scanning. During the manipulation, these two cantilevers work collaboratively as a nanotweezer to grasp, transport and place the nano-objects with real-time force sensing. The manipulation capabilities of the nanotweezer were demonstrated by grabbing and manipulating silicon nanowires to build 3D nanowire crosses. 3D nanomanipulation and nanoassembly performed in air could become feasible through this newly developed 3DMFM.

  1. Tip localization of an atomic force microscope in transmission microscopy with nanoscale precision

    Energy Technology Data Exchange (ETDEWEB)

    Baumann, Fabian; Pippig, Diana A., E-mail: diana.pippig@physik.uni-muenchen.de; Gaub, Hermann E. [Center for Nanoscience and Department of Physics, University of Munich, Amalienstraße 54, 80799 Munich (Germany); Heucke, Stephan F. [Center for Integrated Protein Science Munich (CIPSM), University of Munich, Butenandtstraße 5-13, 81377 Munich (Germany)

    2015-03-15

    Since the atomic force microscope (AFM) has evolved into a general purpose platform for mechanical experiments at the nanoscale, the need for a simple and generally applicable localization of the AFM cantilever in the reference frame of an optical microscope has grown. Molecular manipulations like in single molecule cut and paste or force spectroscopy as well as tip mediated nanolithography are prominent examples for the broad variety of applications implemented to date. In contrast to the different kinds of superresolution microscopy where fluorescence is used to localize the emitter, we, here, employ the absorbance of the tip to localize its position in transmission microscopy. We show that in a low aperture illumination, the tip causes a significant reduction of the intensity in the image plane of the microscope objective when it is closer than a few hundred nm. By independently varying the z-position of the sample slide, we could verify that this diffraction limited image of the tip is not caused by a near field effect but is rather caused by the absorbance of the transmitted light in the low apex needle-like tip. We localized the centroid position of this tip image with a precision of better than 6 nm and used it in a feedback loop to position the tip into nano-apertures of 110 nm radius. Single-molecule force spectroscopy traces on the unfolding of individual green fluorescent proteins within the nano-apertures showed that their center positions were repeatedly approached with very high fidelity leaving the specific handle chemistry on the tip’s surface unimpaired.

  2. An Atomic Force Microscope with Dual Actuation Capability for Biomolecular Experiments

    Science.gov (United States)

    Sevim, Semih; Shamsudhin, Naveen; Ozer, Sevil; Feng, Luying; Fakhraee, Arielle; Ergeneman, Olgaç; Pané, Salvador; Nelson, Bradley J.; Torun, Hamdi

    2016-06-01

    We report a modular atomic force microscope (AFM) design for biomolecular experiments. The AFM head uses readily available components and incorporates deflection-based optics and a piezotube-based cantilever actuator. Jetted-polymers have been used in the mechanical assembly, which allows rapid manufacturing. In addition, a FeCo-tipped electromagnet provides high-force cantilever actuation with vertical magnetic fields up to 0.55 T. Magnetic field calibration has been performed with a micro-hall sensor, which corresponds well with results from finite element magnetostatics simulations. An integrated force resolution of 1.82 and 2.98 pN, in air and in DI water, respectively was achieved in 1 kHz bandwidth with commercially available cantilevers made of Silicon Nitride. The controller and user interface are implemented on modular hardware to ensure scalability. The AFM can be operated in different modes, such as molecular pulling or force-clamp, by actuating the cantilever with the available actuators. The electromagnetic and piezoelectric actuation capabilities have been demonstrated in unbinding experiments of the biotin-streptavidin complex.

  3. A direct micropipette-based calibration method for atomic force microscope cantilevers

    Energy Technology Data Exchange (ETDEWEB)

    Liu Baoyu; Yu Yan; Yao Dakang; Shao Jinyu [Department of Biomedical Engineering, Washington University, Saint Louis, Missouri 63130 (United States)

    2009-06-15

    In this report, we describe a direct method for calibrating atomic force microscope (AFM) cantilevers with the micropipette aspiration technique (MAT). A closely fitting polystyrene bead inside a micropipette is driven by precisely controlled hydrostatic pressures to apply known loads on the sharp tip of AFM cantilevers, thus providing a calibration at the most functionally relevant position. The new method is capable of calibrating cantilevers with spring constants ranging from 0.01 to hundreds of newtons per meter. Under appropriate loading conditions, this new method yields measurement accuracy and precision both within 10%, with higher performance for softer cantilevers. Furthermore, this method may greatly enhance the accuracy and precision of calibration for colloidal probes.

  4. Nanotribological characterization of digital micromirror devices using an atomic force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Liu Huiwen; Bhushan, Bharat

    2004-08-15

    Texas Instruments' digital micromirror device (DMD) comprises an array of fast digital micromirrors, monolithically integrated onto and controlled by an underlying silicon memory chip. The DMD is one of the few success stories in the emerging field of MEMS. In this study, an atomic force microscope (AFM) has been used to characterize the nanotribological properties of the elements of the DMD. An AFM methodology was developed to identify and remove micromirrors of interest. The surface roughness, adhesion, friction, and stiffness properties of the DMD elements were studied. The influence of relative humidity and temperature on the behavior of the DMD element surfaces was also investigated. Potential mechanisms for wear and stiction are discussed in light of the findings.

  5. Surface topography of La-Ti composite oxide nanocrystallines examined with atomic force microscope

    Institute of Scientific and Technical Information of China (English)

    谷俐; 王远亮; 杨华; 唐丽灵; 吴浚瀚; 夏烈文; 罗琦

    2003-01-01

    By means of atomic force microscope, the surface pattern, particle size distribution, and specific surface area of La-Ti composite oxide were studied. The compound particle surface appears as a smooth sheet, the even size of the compound ranges from 19.85nm to 25.38nm. The particle seems smooth, which erects at a height from 4.69nm to 5.88nm.The surface area ranges from 58.90nm2 to 1238.04nm2. The La-Ti composite oxide nanocrystallines enjoy a narrow and even particle size distribution and accumulate closely.

  6. Characterization of a thermoset-thermoplastic interphase using the atomic force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Gruber, N.D.; Lesko, J.J.; Harris, L.A. [Virginia Polytechnic Inst. and State Univ., Blacksburg, VA (United States)] [and others

    1996-12-31

    Recent investigators have shown that the performance of polymer matrix composites can be significantly enhanced by using fibers sized with a thermoplastic polymer. This increase in performance is a result of the sizing material interacting with the matrix resin to form an interphase: a region possessing a gradient in properties different from the sizing material and the matrix resin. Although the influence of the sizing (interphase) on laminate properties has been well documented, quantitative information regarding interphase properties is absent. In this study, {open_quotes}model{close_quotes} composites consisting of polyurethane sized carbon fibers embedded in a vinyl ester matrix were fabricated to characterize the interphase. The atomic force microscope was used to identify the interphase region in these {open_quotes}model{close_quotes} composites.

  7. Nanometer-scale lithography of ultrathin films with atomic force microscope

    CERN Document Server

    Kim, J C; Shin, Y W; Park, S W

    1998-01-01

    Ultrathin resist films have been prepared by both Langmuir-Blodgett (LB) and self-assembly (SA) techniques. Nanometer-scale patterning of these thin films has been performed by using the atomic force microscope (AFM) as the exposing tool. The poly (methylphenylmethacrylate) (PMPMA) LB films were prepared and fabricated by AFM lithography. When the exposure was carried out at the bias voltage of -25V, the protruding lines appeared in the exposed regions. The preoptimized LB films at various conditions exhibited 120 nm line resolution. An organosilane monolayer composed of octadecyldimethylsilyl groups was prepared on a Si substrate. It was then patterned through the localized degradation of the monolayer due to anodic reaction induced by an AFM tip. When the bias voltage was -30 V, the protruding lines appeared in the exposed regions.

  8. Surface topography characterization using an atomic force microscope mounted on a coordinate measuring machine

    DEFF Research Database (Denmark)

    De Chiffre, Leonardo; Hansen, H.N; Kofod, N

    1999-01-01

    The paper describes the construction, testing and use of an integrated system for topographic characterization of fine surfaces on parts having relatively big dimensions. An atomic force microscope (AFM) was mounted on a manual three-coordinate measuring machine (CMM) achieving free positioning...... values in the order of 1 nm. The positioning repeatability of the two horizontal axes of the CMM was determined to +/-1 mu m. Sets of four 20 mu m x 20 mu m areas were traced on fiat objects, combining the data into single 40 mu m x 40 mu m areas, and comparing the roughness values to those for the same...... areas traced in single scans of 40 mu m x 40 mu m. The results show that surface mapping on industrial surfaces is possible using the Least Mean Square alignment provided by the AFM software....

  9. Site-controlled quantum dots fabricated using an atomic-force microscope assisted technique

    Directory of Open Access Journals (Sweden)

    Sakuma Y

    2006-01-01

    Full Text Available AbstractAn atomic-force microscope assisted technique is developed to control the position and size of self-assembled semiconductor quantum dots (QDs. Presently, the site precision is as good as ± 1.5 nm and the size fluctuation is within ± 5% with the minimum controllable lateral diameter of 20 nm. With the ability of producing tightly packed and differently sized QDs, sophisticated QD arrays can be controllably fabricated for the application in quantum computing. The optical quality of such site-controlled QDs is found comparable to some conventionally self-assembled semiconductor QDs. The single dot photoluminescence of site-controlled InAs/InP QDs is studied in detail, presenting the prospect to utilize them in quantum communication as precisely controlled single photon emitters working at telecommunication bands.

  10. Uncertainty compensation methods for quantitative hardness measurement of materials using atomic force microscope nanoindentation technique

    International Nuclear Information System (INIS)

    We suggest uncertainty compensation methods for the quantification of nanoscale indentation using atomic force microscopy (AFM). The main error factors in the force–distance curves originated from the difference between theoretical and real shape of AFM tip during nanoscale indentation measurements. For the uncertainty compensations of tip shapes and misalignment of loading axis, we applied the enhanced tip geometry function and Y-scanner moving to the AFM measurements. Three different materials such as Si wafer, glass, and Au film were characterized with these compensation methods. By applying compensation methods, our results show the decreased values from 167% to 39% below 100 nm indenting depth compared with the literature values. These compensation methods applied to thin films will show the advanced quantitative analysis of hardness measurements using nanoscale indenting AFM. - Highlights: • We suggest uncertainty compensation methods for quantitative hardness measurement. • The main errors during indentation are tip geometry and non-uniform loading. • 3D tip characterization is obtained by using atomic force microscope scan. • The compensation methods perform well in thin films below thickness of 100 nm

  11. Direct observation of phase transition of GeSbTe thin films by Atomic Force Microscope

    Energy Technology Data Exchange (ETDEWEB)

    Yang Fei [National Laboratory of Solid State Microstructures and Jiangsu Provincial Key Laboratory of Photonic and Electronic Materials Sciences and Technology, School of Electronic Science and Engineering, Nanjing University, Nanjing 210093 (China); Xu Ling, E-mail: xuling@nju.edu.cn [National Laboratory of Solid State Microstructures and Jiangsu Provincial Key Laboratory of Photonic and Electronic Materials Sciences and Technology, School of Electronic Science and Engineering, Nanjing University, Nanjing 210093 (China); Zhang Rui; Geng Lei; Tong Liang; Xu Jun [National Laboratory of Solid State Microstructures and Jiangsu Provincial Key Laboratory of Photonic and Electronic Materials Sciences and Technology, School of Electronic Science and Engineering, Nanjing University, Nanjing 210093 (China); Su Weining; Yu Yao [National Laboratory of Solid State Microstructures and Department of Physics, Nanjing University, Nanjing 210093 (China); Ma Zhongyuan; Chen Kunji [National Laboratory of Solid State Microstructures and Jiangsu Provincial Key Laboratory of Photonic and Electronic Materials Sciences and Technology, School of Electronic Science and Engineering, Nanjing University, Nanjing 210093 (China)

    2012-10-01

    Graphical abstract: Nano-sized marks on GST thin film were fabricated using Conductive-AFM (Atomic Force Microscope). The AFM morphology images show that the marks are ablated at the center and a raised ring surrounding it. Highlights: Black-Right-Pointing-Pointer Microstructure of GeSbTe thin films was characterized by XRD and AFM. Black-Right-Pointing-Pointer Annealing and applying electrical field can induce crystallization on thin film. Black-Right-Pointing-Pointer Conductive-AFM was used to modify the surface of GeSbTe thin film. - Abstract: GeSbTe (GST) thin films were deposited on quartz substrates using electron beam evaporation system and then annealed in nitrogen atmosphere at different temperatures, ranging from 20 Degree-Sign C to 300 Degree-Sign C. X-ray diffraction (XRD) and Atomic Force microscope (AFM) measurements were used to characterize the as-deposited and post-annealed thin films. Annealing treatment was found to induce changes on microstructure, surface roughness and grain size, indicating that with the increase of annealing temperature, the amorphous GST films first changed to face-centered-cubic (fcc) phase and then the stable hexagonal (hex) phase. Meanwhile, conductive-AFM (C-AFM) was used to produce crystallized GST dots on thin films. I-V spectroscopy results show that GST films can switch from amorphous state to crystalline state at threshold voltage. After switching, I-V curve exhibits ohmic characteristic, which is usually observed in crystallized GST films. By applying repeated I-V spectroscopies on the thin films, crystallized nuclei were observed. As the times of I-V spectroscopies increases, the area of written dots increases, and the center of the mark begin to ablate. The AFM images show that the shape of marks is an ablated center with a raised ring surrounding it.

  12. Design of a self-aligned, wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with 10 nm magnetic force microscope resolution

    Energy Technology Data Exchange (ETDEWEB)

    Karcı, Özgür [NanoMagnetics Instruments Ltd., Hacettepe - İvedik OSB Teknokent, 1368. Cad., No: 61/33, 06370, Yenimahalle, Ankara (Turkey); Department of Nanotechnology and Nanomedicine, Hacettepe University, Beytepe, 06800 Ankara (Turkey); Dede, Münir [NanoMagnetics Instruments Ltd., Hacettepe - İvedik OSB Teknokent, 1368. Cad., No: 61/33, 06370, Yenimahalle, Ankara (Turkey); Oral, Ahmet, E-mail: orahmet@metu.edu.tr [Department of Physics, Middle East Technical University, 06800 Ankara (Turkey)

    2014-10-01

    We describe the design of a wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with a self-aligned fibre-cantilever mechanism. An alignment chip with alignment groves and a special mechanical design are used to eliminate tedious and time consuming fibre-cantilever alignment procedure for the entire temperature range. A low noise, Michelson fibre interferometer was integrated into the system for measuring deflection of the cantilever. The spectral noise density of the system was measured to be ~12 fm/√Hz at 4.2 K at 3 mW incident optical power. Abrikosov vortices in BSCCO(2212) single crystal sample and a high density hard disk sample were imaged at 10 nm resolution to demonstrate the performance of the system.

  13. Lipid memberane:inelastic deformation of surface structure by an atomic force microscope

    Institute of Scientific and Technical Information of China (English)

    2002-01-01

    The stability of the 1,2-Dioleoyl-sn-Glycero-3-[phospho-rac-1-Glycerol-Na] liposome in the liquid crystalline state have been investigated using an atomic force microscope(AFM),We have observed the inelastic deformation of the sample surface,The AFM tip causes persistent deformation of the surface of the lipid membrane,in which some of the lipid molecules are eventually pushed or dragged by the AFM tip.The experiment shows how the surface structure of the lipid membrane can be created by the interaction between the AFM tip and lipid membrane.When the operating force exceeds 10-8N,it leads to large deformations of the surface.A squareregion of about 1×1um2 is created by the scanning probe on the surface,When the operating force is between 10-11N and 10-8N,it can image the topography of the surface of the lipid membrane.The stability of the sample is related to the concentration of the medium in which the sample is prepared.

  14. Development of a Hybrid Atomic Force Microscopic Measurement System Combined with White Light Scanning Interferometry

    Directory of Open Access Journals (Sweden)

    Xiaotang Hu

    2011-12-01

    Full Text Available A hybrid atomic force microscopic (AFM measurement system combined with white light scanning interferometry for micro/nanometer dimensional measurement is developed. The system is based on a high precision large-range positioning platform with nanometer accuracy on which a white light scanning interferometric module and an AFM head are built. A compact AFM head is developed using a self-sensing tuning fork probe. The head need no external optical sensors to detect the deflection of the cantilever, which saves room on the head, and it can be directly fixed under an optical microscopic interferometric system. To enhance the system’s dynamic response, the frequency modulation (FM mode is adopted for the AFM head. The measuring data can be traceable through three laser interferometers in the system. The lateral scanning range can reach 25 mm × 25 mm by using a large-range positioning platform. A hybrid method combining AFM and white light scanning interferometry is proposed to improve the AFM measurement efficiency. In this method, the sample is measured firstly by white light scanning interferometry to get an overall coarse morphology, and then, further measured with higher resolution by AFM. Several measuring experiments on standard samples demonstrate the system’s good measurement performance and feasibility of the hybrid measurement method.

  15. Lipid membrane: inelastic deformation of surface structure by an atomic force microscope

    Institute of Scientific and Technical Information of China (English)

    张静; 孙润广

    2002-01-01

    The stability of the 1,2-Dioleoyl-sn-Glycero-3-[phospho-rac-1-Glycerol-Na] liposome in the liquid crystalline statehave been investigated using an atomic force microscope (AFM). We have observed the inelastic deformation of thesample surface. The AFM tip causes persistent deformation of the surface of the lipid membrane, in which some of thelipid molecules are eventually pushed or dragged by the AFM tip. The experiment shows how the surface structure ofthe lipid membrane can be created by the interaction between the AFM tip and lipid membrane. When the operatingforce exceeds 10-8 N, it leads to large deformations of the surface. A square region of about 1×1μm2 is created by thescanning probe on the surface. When the operating force is between 10-11N and 10-8N, it can image the topographyof the surface of the lipid membrane. The stability of the sample is related to the concentration of the medium in whichthe sample is prepared.

  16. Determination of the Elastic Properties of Tomato Fruit Cells with an Atomic Force Microscope

    Directory of Open Access Journals (Sweden)

    Andrzej Kurenda

    2013-09-01

    Full Text Available Since the mechanical properties of single cells together with the intercellular adhesive properties determine the macro-mechanical properties of plants, a method for evaluation of the cell elastic properties is needed to help explanation of the behavior of fruits and vegetables in handling and food processing. For this purpose, indentation of tomato mesocarp cells with an atomic force microscope was used. The Young’s modulus of a cell using the Hertz and Sneddon models, and stiffness were calculated from force-indentation curves. Use of two probes of distinct radius of curvature (20 nm and 10,000 nm showed that the measured elastic properties were significantly affected by tip geometry. The Young’s modulus was about 100 kPa ± 35 kPa and 20 kPa ± 14 kPa for the sharper tip and a bead tip, respectively. Moreover, large variability regarding elastic properties (>100% among cells sampled from the same region in the fruit was observed. We showed that AFM provides the possibility of combining nano-mechanical properties with topography imaging, which could be very useful for the study of structure-related properties of fruits and vegetables at the cellular and sub-cellular scale.

  17. Determination of the elastic properties of tomato fruit cells with an atomic force microscope.

    Science.gov (United States)

    Zdunek, Artur; Kurenda, Andrzej

    2013-01-01

    Since the mechanical properties of single cells together with the intercellular adhesive properties determine the macro-mechanical properties of plants, a method for evaluation of the cell elastic properties is needed to help explanation of the behavior of fruits and vegetables in handling and food processing. For this purpose, indentation of tomato mesocarp cells with an atomic force microscope was used. The Young's modulus of a cell using the Hertz and Sneddon models, and stiffness were calculated from force-indentation curves. Use of two probes of distinct radius of curvature (20 nm and 10,000 nm) showed that the measured elastic properties were significantly affected by tip geometry. The Young's modulus was about 100 kPa ± 35 kPa and 20 kPa ± 14 kPa for the sharper tip and a bead tip, respectively. Moreover, large variability regarding elastic properties (>100%) among cells sampled from the same region in the fruit was observed. We showed that AFM provides the possibility of combining nano-mechanical properties with topography imaging, which could be very useful for the study of structure-related properties of fruits and vegetables at the cellular and sub-cellular scale. PMID:24030683

  18. Simulating atomic force microscope images with density functional theory: The role of nonclassical contributions to the force

    Science.gov (United States)

    Schaffhauser, Philipp; Kümmel, Stephan

    2016-07-01

    We discuss a scheme for calculating atomic force microscope images within the framework of density functional theory (DFT). As in earlier works [T. L. Chan et al., Phys. Rev. Lett. 102, 176101 (2009), 10.1103/PhysRevLett.102.176101; M. Kim and J. R. Chelikowsky, Appl. Surf. Sci. 303, 163 (2014), 10.1016/j.apsusc.2014.02.127] we do not simulate the cantilever explicitly, but consider it as a polarizable object. We go beyond previous studies by discussing the role of exchange and correlation effects; i.e., we approximately take into account the Pauli interaction between sample and cantilever. The good agreement that we find when comparing our calculated images to experimental images for the difficult case of the 8-hydroxyquinoline molecule demonstrates that exchange-correlation effects can play an important role in the DFT-based interpretation of AFM images.

  19. Reconstruction of the Tip-Surface Interaction Potential by Analysis of the Brownian Motion of an Atomic Force Microscope Tip

    NARCIS (Netherlands)

    Willemsen, Oscar H.; Kuipers, Laurens; Werf, van der Kees O.; Grooth, de Bart G.; Greve, Jan

    2000-01-01

    The thermal movement of an atomic force microscope (AFM) tip is used to reconstruct the tip-surface interaction potential. If a tip is brought into the vicinity of a surface, its movement is governed by the sum of the harmonic cantilever potential and the tip-surface interaction potential. By simula

  20. In situ observation of surface structures of cardiovascular endothelial cells with atomic force microscope

    Institute of Scientific and Technical Information of China (English)

    Tong Yin; Jin Luo; YaMin Ma; Xiao-Long Ji; Yu-Sheng Zhao; Shi-Wen Wang

    2009-01-01

    Objective To observe the surface structures of cardiovascular endothelial cells in situ with atomic force microscope (AFM). Methods Fresh aorta and aortic valve were dissected from 10 healthy male New Zealand white rabbits. Before fixed in 1% formaldehyde, the fresh tissues were washed in the buffer phosphate solution. Under general microscope, the fixed aorta or valve was spread on the double side stick tape which had already been stuck on the glass slide. The intima of aorta or the aorta side of valve was towards upside. Then the specimen was dried under 37 degrees centigrade in an attemperator and was washed with pure water. After dried again, the specimen was loaded on the platform ofNanoScope llla AFM and was scanned in tapping mode with the scanning speed of 0.5 HZ. Results The surface structures of endothelial cell on the fixed and dried tissue could be obsserved clearly in situ with AFM. Aortic endothclial cells were large, branched and arranged sparsely and parallel to the direction of blood flow, whereas endothelial cells on aorta valve surface were small, less branched and arranged intensively and vertical to the direction of blood flow. When the scanning range was dwindled, granular ultra-structures could be observed on the surface of endothelial cells, and, as the scanning range was dwindled further, fissure and convolution could be seen on the surface of granules from aortic endothelial cells. Centre cavity and surrounding swelling volcano-like structure could be seen on the surface of granules from endothelial cells of aortic valve. Conclusions It's feasible to observe the surface ultra-structures of cardiovascular endothelial cells in situ with AFM and morphological information provided by A FM might be of clinical value in future histopathological diagnosis.

  1. Detection of erythrocytes influenced by aging and type 2 diabetes using atomic force microscope

    International Nuclear Information System (INIS)

    The pathophysiological changes of erythrocytes are detected at the molecular scale, which is important to reveal the onset of diseases. Type 2 diabetes is an age-related metabolic disorder with high prevalence in elderly (or old) people. Up to now, there are no treatments to cure diabetes. Therefore, early detection and the ability to monitor the progression of type 2 diabetes are very important for developing effective therapies. Type 2 diabetes is associated with high blood glucose in the context of insulin resistance and relative insulin deficiency. These abnormalities may disturb the architecture and functions of erythrocytes at molecular scale. In this study, the aging- and diabetes-induced changes in morphological and biomechanical properties of erythrocytes are clearly characterized at nanometer scale using atomic force microscope (AFM). The structural information and mechanical properties of the cell surface membranes of erythrocytes are very important indicators for determining the healthy, diseased or aging status. So, AFM may potentially be developed into a powerful tool in diagnosing diseases.

  2. Atomic Force Microscope Imaging of the Aggregation of Mouse Immunoglobulin G Molecules

    Directory of Open Access Journals (Sweden)

    Ke Xia

    2003-01-01

    Full Text Available Mouse immunoglobulin G (Ig G1 and the mixture of Ig G1 and Ig G2 deposited on mica were imaged with an atomic force microscope at room temperature and ambient pressure. At a concentration around 1.0mg/L, the molecules were well dispersed. 2~3 days after sample preparation, both Ig G1 and the mixture could self- assemble into different shapes and further form some types of local-ordered toroidal aggregations (monotoroidal, intercrossed toroidal, concentric toroidal, etc.. The number of monomers was not identical in the different toroidal aggregations but in a same circle, the shapes of polymer self-assembled by several monomolecules were found to be almost the same. There was difference between the aggregation behavior of Ig G1 and the mixture. The mechanism of Ig G molecule aggregation was ascribed to the “Y” shape and loops structure of Ig G molecule.

  3. Atomic force microscopic study on topological structures of pBR322 DNA

    Institute of Scientific and Technical Information of China (English)

    张平城; 白春礼; 成英俊; 方晔; 王中怀; 黄熙泰

    1996-01-01

    Plasmid pBR322 DNA (0.5mg/mL) isolated from Escherichia coli HB101 was suspended in Tris-HCl-EDTA (1 mol/L - 0.1 mol/L, pH8.5); then a drop of the above solution was deposited on freshly cleaved mica substrate. After adsorption for about 1 min, the sample was stained with phosphotungstic acid. The residua] solution was removed with a piece of filter paper. Afterwards the sample was imaged with a home-made atomic force microscope (AFM) in air. The AFM images of pBR322 DNA with a molecular resolution have been obtained. These images show that pBR322 DNA exists in several different topological structures: (i) relaxed circular DNA with a different diameter; (ii) supercondensed DNA with different particle sizes; (iii) dimeric catenane connected by one relaxed circular molecule and another dose-compacted molecule which might be either supercoiled or intramolecular knotted form; (iv) oligomeric catenane with multiple irregular molecules in which DNA is interlocked into a complex oligomer; (v) possibly-existing

  4. The asymmetrical structure of Golgi apparatus membranes revealed by in situ atomic force microscope.

    Directory of Open Access Journals (Sweden)

    Haijiao Xu

    Full Text Available The Golgi apparatus has attracted intense attentions due to its fascinating morphology and vital role as the pivot of cellular secretory pathway since its discovery. However, its complex structure at the molecular level remains elusive due to limited approaches. In this study, the structure of Golgi apparatus, including the Golgi stack, cisternal structure, relevant tubules and vesicles, were directly visualized by high-resolution atomic force microscope. We imaged both sides of Golgi apparatus membranes and revealed that the outer leaflet of Golgi membranes is relatively smooth while the inner membrane leaflet is rough and covered by dense proteins. With the treatment of methyl-β-cyclodextrin and Triton X-100, we confirmed the existence of lipid rafts in Golgi apparatus membrane, which are mostly in the size of 20 nm -200 nm and appear irregular in shape. Our results may be of significance to reveal the structure-function relationship of the Golgi complex and pave the way for visualizing the endomembrane system in mammalian cells at the molecular level.

  5. Atomic force microscopic observation on substructure of pollen exine in Cedrus deodara and Metasequoia glyptostroboides

    Institute of Scientific and Technical Information of China (English)

    2000-01-01

    The substructure of pollen exine in Cedrus deodara (Roxb.) Loud. and Metasequoia glyptostroboides Hu et Cheng has been examined with an atomic force microscope (AFM). The results indicate that the exine substructure units containing sporopollenin in two species are similar in shape, which are granular, but slightly different in size. In Cedrus the substructure unit of pollen exine appears to be 56-99 nm long and 42-74 nm wide, while in Metasequoia it appears to be 81-118 nm long and 43-98 nm wide. It has been observed that the subunits of pollen exine in Cedrus arranged tightly to form short-rod-like or spheroidal pollen exine units, several or more than ten of which formed an island-like structure. There are various spaces among these island-like structures which are interconnected to occupy the entire pollen exine. In Metasequoia, the subunits of pollen exine also arranged tightly with a distribution tendency of cluster of 3-10, however, no obvious boundary exists among these clusters. From our results, it is concluded that there is no tendency of helical arrangement for the subunits of pollen exine in Cedrus and Metasequoia, and the results support Southworth' view that subunits of pollen exine are granular shape in lattice structure.

  6. In Situ Roughness Measurements for the Solar Cell Industry Using an Atomic Force Microscope

    Directory of Open Access Journals (Sweden)

    Higinio González-Jorge

    2010-04-01

    Full Text Available Areal roughness parameters always need to be under control in the thin film solar cell industry because of their close relationship with the electrical efficiency of the cells. In this work, these parameters are evaluated for measurements carried out in a typical fabrication area for this industry. Measurements are made using a portable atomic force microscope on the CNC diamond cutting machine where an initial sample of transparent conductive oxide is cut into four pieces. The method is validated by making a comparison between the parameters obtained in this process and in the laboratory under optimal conditions. Areal roughness parameters and Fourier Spectral Analysis of the data show good compatibility and open the possibility to use this type of measurement instrument to perform in situ quality control. This procedure gives a sample for evaluation without destroying any of the transparent conductive oxide; in this way 100% of the production can be tested, so improving the measurement time and rate of production.

  7. Nanoimaging and ultra structure of Entamoeba histolytica and its pseudopods by using atomic force microscope

    Science.gov (United States)

    Joshi, Narahari V.; Medina, Honorio; Urdaneta, H.; Barboza, J.

    2000-04-01

    Nan-imaging of Entamoeba histolytica was carried out by using Atomic Force Microscope (AFM). The structure of the nucleus, endoplasm and ectoplasm were studied separately. The diameter of the nucleus in living E. histolytica was found to be of the order of 10 micrometers which is slightly higher than the earlier reported value. The presence of karysome was detected in the nucleus. Well-organized patterns of chromatoid bodies located within the endoplasm, were detected and their repetitive patterns were examined. The organized structure was also extended within the ectoplasm. The dimensions and form of the organization suggest that chromatic bodies are constituted with ribosomes ordered in the form of folded sheet. Such structures were found to be absent in non-living E. histolytica. AFM images were also captured just in the act when ameba was extending its pseudopods. Alteration in the ultrastructure caused during the process of extension was viewed. Well marked canals of width 694.05 nm. And height 211.05 nm are clearly perceptible towards the direction of the pseudopods. 3D images are presented to appreciate the height variation, which can not be achieved by conventional well-established techniques such as electron microscopy.

  8. Detection of erythrocytes influenced by aging and type 2 diabetes using atomic force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Jin, Hua; Xing, Xiaobo [Chemistry Department, Jinan University, Guangzhou 510632 (China); Zhao, Hongxia [Chemistry Department, Jinan University, Guangzhou 510632 (China); Faculty of Chemical Engineering and Light Industry, Guangdong University of Technology, Guangzhou 510090 (China); Chen, Yong [Institute for Advanced Study, Nanchang University, Nanchang, Jiangxi 330031 (China); Huang, Xun [Chemistry Department, Jinan University, Guangzhou 510632 (China); Ma, Shuyuan [Chemistry Department, Jinan University, Guangzhou 510632 (China); The First Affiliated Hospital, Jinan University, Guangzhou 510632 (China); Ye, Hongyan [Chemistry Department, Jinan University, Guangzhou 510632 (China); Cai, Jiye, E-mail: tjycai@jnu.edu.cn [Chemistry Department, Jinan University, Guangzhou 510632 (China)

    2010-01-22

    The pathophysiological changes of erythrocytes are detected at the molecular scale, which is important to reveal the onset of diseases. Type 2 diabetes is an age-related metabolic disorder with high prevalence in elderly (or old) people. Up to now, there are no treatments to cure diabetes. Therefore, early detection and the ability to monitor the progression of type 2 diabetes are very important for developing effective therapies. Type 2 diabetes is associated with high blood glucose in the context of insulin resistance and relative insulin deficiency. These abnormalities may disturb the architecture and functions of erythrocytes at molecular scale. In this study, the aging- and diabetes-induced changes in morphological and biomechanical properties of erythrocytes are clearly characterized at nanometer scale using atomic force microscope (AFM). The structural information and mechanical properties of the cell surface membranes of erythrocytes are very important indicators for determining the healthy, diseased or aging status. So, AFM may potentially be developed into a powerful tool in diagnosing diseases.

  9. Preliminarily Investigating the Polymorphism of Self-organized Actin Filament in Vitro by Atomic Force Microscope

    Institute of Scientific and Technical Information of China (English)

    Jun ZHANG; Yuan-Liang WANG; Xin-Yong Chen; Chuang-Long HE; Chao CHENG; Yang CAO

    2004-01-01

    With the atomic force microscope (AFM), we preliminarily investigated the large-scale structure of actin filaments formed in low concentration protein solution (5 μg/ml) via self-organization without the presence of any F-actin dynamic interfering factors (such as phalloidin) in vitro. It was found that the G-actin could be polymerized into ordered filamentous structures with different diameter from the slimmest filament of single F-actin to giant filament in tree-like branched aggregates. The observed polymerized actin filaments, to which our most intense attention was attracted, was discretely distributed and showed obvious polymorphism distinctly different from those in the presence of phalloidin or actin binding proteins (fimbrin, gelsolin, etc.) in previous experiments. Latter structures were mainly composed of single F-actin and/or multifilaments clearly consisting of several single F-actin. The experimental results clearly demonstrated that non-interference with the F-actin intrinsic dynamics in self-organizing could lead to the polymorphism of actin filamentous structures, and further analysis implied that the disturbance of normal F-actin dynamics by many factors could prevent the emergence of structural polymorphism, more often than not, give rise to formation of specific structures instead and different interference would bring about various particular structures under certain conditions.

  10. A measurement of the hysteresis loop in force-spectroscopy curves using a tuning-fork atomic force microscope

    OpenAIRE

    Manfred Lange; Dennis van Vörden; Rolf Möller

    2012-01-01

    Measurements of the frequency shift versus distance in noncontact atomic force microscopy (NC-AFM) allow measurements of the force gradient between the oscillating tip and a surface (force-spectroscopy measurements). When nonconservative forces act between the tip apex and the surface the oscillation amplitude is damped. The dissipation is caused by bistabilities in the potential energy surface of the tip–sample system, and the process can be understood as a hysteresis of forces between...

  11. Fabrication of large scale nanostructures based on a modified atomic force microscope nanomechanical machining system.

    Science.gov (United States)

    Hu, Z J; Yan, Y D; Zhao, X S; Gao, D W; Wei, Y Y; Wang, J H

    2011-12-01

    The atomic force microscope (AFM) tip-based nanomechanical machining has been demonstrated to be a powerful tool for fabricating complex 2D∕3D nanostructures. But the machining scale is very small, which holds back this technique severely. How to enlarge the machining scale is always a major concern for the researches. In the present study, a modified AFM tip-based nanomechanical machining system is established through combination of a high precision X-Y stage with the moving range of 100 mm × 100 mm and a commercial AFM in order to enlarge the machining scale. It is found that the tracing property of the AFM system is feasible for large scale machining by controlling the constant normal load. Effects of the machining parameters including the machining direction and the tip geometry on the uniform machined depth with a large scale are evaluated. Consequently, a new tip trace and an increasing load scheme are presented to achieve a uniform machined depth. Finally, a polymer nanoline array with the dimensions of 1 mm × 0.7 mm, the line density of 1000 lines/mm and the average machined depth of 150 nm, and a 20 × 20 polymer square holes array with the scale of 380 μm × 380 μm and the average machined depth of 250 nm are machined successfully. The uniform of the machined depths for all the nanostructures is acceptable. Therefore, it is verified that the AFM tip-based nanomechanical machining method can be used to machine millimeter scale nanostructures.

  12. 'Sub-atomic' resolution of non-contact atomic force microscope images induced by a heterogeneous tip structure: a density functional theory study

    Energy Technology Data Exchange (ETDEWEB)

    Campbellova, Anna; Klapetek, Petr [Czech Metrology Institute, OkruznI 31, 638 00, Brno (Czech Republic); Ondracek, Martin; JelInek, Pavel [Institute of Physics, Academy of Sciences of the Czech Republic, Cukrovarnicka 10, 162 00 Prague (Czech Republic); Pou, Pablo; Perez, Ruben, E-mail: jelinekp@fzu.cz [Departamento de Fisica Teorica de la Materia Condensada, Universidad Autonoma de Madrid, 28049 Madrid (Spain)

    2011-07-22

    A Si adatom on a Si(111)-(7 x 7) reconstructed surface is a typical atomic feature that can rather easily be imaged by a non-contact atomic force microscope (nc-AFM) and can be thus used to test the atomic resolution of the microscope. Based on our first principles density functional theory (DFT) calculations, we demonstrate that the structure of the termination of the AFM tip plays a decisive role in determining the appearance of the adatom image. We show how the AFM image changes depending on the tip-surface distance and the composition of the atomic apex at the end of the tip. We also demonstrate that contaminated tips may give rise to image patterns displaying so-called 'sub-atomic' features even in the attractive force regime.

  13. Influence of measuring parameters on the accuracy of atomic force microscope in industrial applications

    DEFF Research Database (Denmark)

    Tosello, Guido; Antico, Andrea; Hansen, Hans Nørgaard;

    2009-01-01

    Atomic Force Microscopy (AFM) is a powerful technique providing 3D surface topographies with very high resolution in both lateral and vertical direction. Thanks to its relatively easy use, AFM can be well introduced in process control, gaining great advantage in research as well as in the evaluat......Atomic Force Microscopy (AFM) is a powerful technique providing 3D surface topographies with very high resolution in both lateral and vertical direction. Thanks to its relatively easy use, AFM can be well introduced in process control, gaining great advantage in research as well...

  14. Micropore Structure Representation of Sandstone in Petroleum Reservoirs Using an Atomic Force Microscope

    Institute of Scientific and Technical Information of China (English)

    BAI Yong-Qiang; ZHU Xing; WU Jun-Zheng; BAI Wen-Guang

    2011-01-01

    @@ The pore structure of sandstone in an oil reservoir is investigated using atomic force microscopy(AFM).At nanoscale resolution,AFM images of sandstone show us the fine structure.The real height data of images display the three-dimensional space structure of sandstone effectively.The three-dimensional analysis results show that the AFM images of sandstone have unique characteristics that,like fingerprints,can identify different structural properties of sandstones.The results demonstrate that AFM is an effective method used to represent original sandstone in petroleum reservoirs,and may help geologists to appreciate the sandstone in oil reservoirs fully.

  15. A measurement of the hysteresis loop in force-spectroscopy curves using a tuning-fork atomic force microscope.

    Science.gov (United States)

    Lange, Manfred; van Vörden, Dennis; Möller, Rolf

    2012-01-01

    Measurements of the frequency shift versus distance in noncontact atomic force microscopy (NC-AFM) allow measurements of the force gradient between the oscillating tip and a surface (force-spectroscopy measurements). When nonconservative forces act between the tip apex and the surface the oscillation amplitude is damped. The dissipation is caused by bistabilities in the potential energy surface of the tip-sample system, and the process can be understood as a hysteresis of forces between approach and retraction of the tip. In this paper, we present the direct measurement of the whole hysteresis loop in force-spectroscopy curves at 77 K on the PTCDA/Ag/Si(111) √3 × √3 surface by means of a tuning-fork-based NC-AFM with an oscillation amplitude smaller than the distance range of the hysteresis loop. The hysteresis effect is caused by the making and breaking of a bond between PTCDA molecules on the surface and a PTCDA molecule at the tip. The corresponding energy loss was determined to be 0.57 eV by evaluation of the force-distance curves upon approach and retraction. Furthermore, a second dissipation process was identified through the damping of the oscillation while the molecule on the tip is in contact with the surface. This dissipation process occurs mainly during the retraction of the tip. It reaches a maximum value of about 0.22 eV/cycle. PMID:22496993

  16. Nanoscale imaging of the growth and division of bacterial cells on planar substrates with the atomic force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Van Der Hofstadt, M. [Institut de Bioenginyeria de Catalunya (IBEC), C/ Baldiri i Reixac 11-15, 08028 Barcelona (Spain); Hüttener, M.; Juárez, A. [Institut de Bioenginyeria de Catalunya (IBEC), C/ Baldiri i Reixac 11-15, 08028 Barcelona (Spain); Departament de Microbiologia, Universitat de Barcelona, Avinguda Diagonal 645, 08028 Barcelona (Spain); Gomila, G., E-mail: ggomila@ibecbarcelona.eu [Institut de Bioenginyeria de Catalunya (IBEC), C/ Baldiri i Reixac 11-15, 08028 Barcelona (Spain); Departament d' Electronica, Universitat de Barcelona, C/ Marti i Franqués 1, 08028 Barcelona (Spain)

    2015-07-15

    With the use of the atomic force microscope (AFM), the Nanomicrobiology field has advanced drastically. Due to the complexity of imaging living bacterial processes in their natural growing environments, improvements have come to a standstill. Here we show the in situ nanoscale imaging of the growth and division of single bacterial cells on planar substrates with the atomic force microscope. To achieve this, we minimized the lateral shear forces responsible for the detachment of weakly adsorbed bacteria on planar substrates with the use of the so called dynamic jumping mode with very soft cantilever probes. With this approach, gentle imaging conditions can be maintained for long periods of time, enabling the continuous imaging of the bacterial cell growth and division, even on planar substrates. Present results offer the possibility to observe living processes of untrapped bacteria weakly attached to planar substrates. - Highlights: • Gelatine coatings used to weakly attach bacterial cells onto planar substrates. • Use of the dynamic jumping mode as a non-perturbing bacterial imaging mode. • Nanoscale resolution imaging of unperturbed single living bacterial cells. • Growth and division of single bacteria cells on planar substrates observed.

  17. Preparation of La-Ti Composite Oxide Nanocrystal and Examination of Their Surface Topography with Atomic Force Microscope

    Institute of Scientific and Technical Information of China (English)

    2003-01-01

    With sol-gel method, nanometer La-Ti composite oxide was successfully prepared at a low temperature (750~800℃) using polyethylene glycol as dispersant. By means of atomic force microscope, the surface pattern, particle size distribution, and specific surface area were studied. The compound particle surface appears as a smooth sheet, the mean size of the compound is 25.38 nm. On the specific surface, the particle erects at a height of 4.69 nm. The surface area is 58.90 nm2. The La-Ti composite oxide nanocrystal prefers to narrow and even particle size distribution and the homogeneity of surface topography.

  18. Modification of a YBa2Cu3O7-δ Thin Film Using an Atomic Force Microscope

    Institute of Scientific and Technical Information of China (English)

    尤立星; 尹晓波; 冯一军; 杨森祖; 康琳; 王牧; 吴培亨

    2002-01-01

    A YBa2Cu3O7-δ thin film is modified by a probe electric field of an atomic force microscope to form a ridge with the width of only a grain cell. The modification varies with the operation parameters of the bias voltage,the moving velocity of the probe and the ambient humidity. Energy dispersive spectroscopy analysis shows only oxygen deficiency in the modified YBCO thin film. As a result, the suppressed superconductivity was found in the junction crossing the ridge.

  19. Modified atomic force microscope applied to the measurement of elastic modulus for a single peptide molecule

    Science.gov (United States)

    Ptak, Arkadiusz; Takeda, Seiji; Nakamura, Chikashi; Miyake, Jun; Kageshima, Masami; Jarvis, Suzanne P.; Tokumoto, Hiroshi

    2001-09-01

    A modified atomic force microscopy (AFM) system, based on a force modulation technique, has been used to find an approximate value for the elastic modulus of a single peptide molecule directly from a mechanical test. For this purpose a self-assembled monolayer built from two kinds of peptides, reactive (able to anchor to the AFM tip) and nonreactive, was synthesized. In a typical experiment a single C3K30C (C=cysteine, K=lysine) peptide molecule was stretched between a Au(111) substrate and the gold-coated tip of an AFM cantilever to which it was attached via gold-sulfur bonds. The amplitude of the cantilever oscillations, due to an external force applied via a magnetic particle to the cantilever, was recorded by a lock-in amplifier and recalculated into stiffness of the stretched molecule. A longitudinal Young's modulus for the α-helix of a single peptide molecule and for the elongated state of this molecule has been estimated. The obtained values; 1.2±0.3 and 50±15 GPa, for the peptide α-helix and elongated peptide backbone, respectively, seem to be reasonable comparing them to the Young's modulus of protein crystals and linear organic polymers. We believe this research opens up a means by which scientists can perform quantitative studies of the elastic properties of single molecule, especially of biologically important polymers like peptides or DNA.

  20. A measurement of the hysteresis loop in force-spectroscopy curves using a tuning-fork atomic force microscope

    Directory of Open Access Journals (Sweden)

    Manfred Lange

    2012-03-01

    Full Text Available Measurements of the frequency shift versus distance in noncontact atomic force microscopy (NC-AFM allow measurements of the force gradient between the oscillating tip and a surface (force-spectroscopy measurements. When nonconservative forces act between the tip apex and the surface the oscillation amplitude is damped. The dissipation is caused by bistabilities in the potential energy surface of the tip–sample system, and the process can be understood as a hysteresis of forces between approach and retraction of the tip. In this paper, we present the direct measurement of the whole hysteresis loop in force-spectroscopy curves at 77 K on the PTCDA/Ag/Si(111 √3 × √3 surface by means of a tuning-fork-based NC-AFM with an oscillation amplitude smaller than the distance range of the hysteresis loop. The hysteresis effect is caused by the making and breaking of a bond between PTCDA molecules on the surface and a PTCDA molecule at the tip. The corresponding energy loss was determined to be 0.57 eV by evaluation of the force–distance curves upon approach and retraction. Furthermore, a second dissipation process was identified through the damping of the oscillation while the molecule on the tip is in contact with the surface. This dissipation process occurs mainly during the retraction of the tip. It reaches a maximum value of about 0.22 eV/cycle.

  1. Indentation of poroviscoelastic vocal fold tissue using an atomic force microscope.

    Science.gov (United States)

    Heris, Hossein K; Miri, Amir K; Tripathy, Umakanta; Barthelat, Francois; Mongeau, Luc

    2013-12-01

    The elastic properties of the vocal folds (VFs) vary as a function of depth relative to the epithelial surface. The poroelastic anisotropic properties of porcine VFs, at various depths, were measured using atomic force microscopy (AFM)-based indentation. The minimum tip diameter to effectively capture the local properties was found to be 25µm, based on nonlinear laser scanning microscopy data and image analysis. The effects of AFM tip dimensions and AFM cantilever stiffness were systematically investigated. The indentation tests were performed along the sagittal and coronal planes for an evaluation of the VF anisotropy. Hertzian contact theory was used along with the governing equations of linear poroelasticity to calculate the diffusivity coefficient of the tissue from AFM indentation creep testing. The permeability coefficient of the porcine VF was found to be 1.80±0.32×10(-15)m(4)/Ns. PMID:23829979

  2. Femtosecond laser irradiation of indium phosphide in air: Raman spectroscopic and atomic force microscopic investigations

    Energy Technology Data Exchange (ETDEWEB)

    Bonse, J.; Wrobel, J.M.; Brzezinka, K.-W.; Esser, N.; Kautek, W

    2002-12-30

    Surface modification and ablation of crystalline indium phosphide was performed with single and double 130 fs pulses from a Ti:sapphire laser. The morphological features resulting from laser processing, have been investigated by means of micro Raman spectroscopy as well as by optical, atomic force and scanning electron microscopy. The studies indicate amorphous, ablated and recrystallized zones on the processed surface. In the single-pulse irradiation experimentsveral different threshold fluences could be assigned to the processes of melting, ablation and polycrystalline resolidification. Residual stress has been detected within the irradiated areas. Double-pulse exposure experiments have been analyzed in order to clarify the effect of cumulative damage in the ablation process of indium phosphide.

  3. Note: A stand on the basis of atomic force microscope to study substrates for imaging optics

    Energy Technology Data Exchange (ETDEWEB)

    Chkhalo, N. I.; Salashchenko, N. N.; Zorina, M. V. [Department of Multilayer Optics, Institute for Physics of Microstructures of the Russian Academy of Sciences, GSP-105, 603950 Nizhny Novgorod (Russian Federation)

    2015-01-15

    A description of a stand based on atomic force microscopy (AFM) for roughness measurements of large optical components with arbitrary surfaces is given. The sample under study is mounted on a uniaxial goniometer which allows the sample to be tilted in the range of ±30°. The inclination enables the local normal along the axis of the probe to be established at any point of the surface under study. A comparison of the results of the measurement of noise and roughness of a flat quartz sample, in the range of spatial frequencies 0.025–70 μm{sup −1}, obtained from “standard” AFM and developed versions is given. Within the experimental error, the measurement results were equivalent. Examples of applications of the stand for the study of substrates for X-ray optics are presented.

  4. System design and new applications for atomic force microscope based on tunneling

    Science.gov (United States)

    Wang, X.; Liu, A. P.; Yang, X. H.

    2015-09-01

    The design of atomic force microscopy (AFM) with high resolution is introduced in this paper. Mainly, we have developed the system design of the apparatus based on tunneling. AFM.IPC-208B, this kind of apparatus combines scanning tunnel microscopy (STM) and AFM availability, and its lens body with original frame enhances the capability of the machine. In order to analyze the performance of AFM.IPC-208B, as a new tool in the field of Life Science, we make use of the system to study natural mica and molecular protein structures of Cattle-insulin and human antibody immunoglobulin G (IgG) coupled with staphylococcus protein A (SPA). As the results of new applications, the resolution of AFM.IPC-208B is proved to be 0.1 nm, and these nanometer measurement results provide much valuable information for the study of small molecular proteins and HIV experiments.

  5. Competitive Adsorption between Bovine Serum Albumin and Collagen Observed by Atomic Force Microscope

    Institute of Scientific and Technical Information of China (English)

    Yong YU; Pei Qing YING; Gang JIN

    2004-01-01

    Atomic force microscopy (AFM) was used to study the competitive adsorption between bovine serum albumin (BSA) and type Ⅰ collagen on hydrophilic and hydrophobic silicon wafers.BSA showed a grain shape and the type I collagen displayed fibril-like molecules with relatively homogeneous height and width, characterized with clear twisting (helical formation). These AFM images illustrated that quite a lot of type I collagen appeared in the adsorption layer on hydrophilic surface in a competitive adsorption state, but the adsorption of BSA was more preponderant than that of type I collagen on hydrophobic silicon wafer surface. The experiments showed that the influence of BSA on type I collagen adsorption on hydrophilic surface was less than that on hydrophobic surface.

  6. Temperature and non-linear response of cantilever-type mechanical oscillators used in atomic force microscopes with interferometric detection

    Energy Technology Data Exchange (ETDEWEB)

    Fläschner, G.; Ruschmeier, K.; Schwarz, A., E-mail: aschwarz@physnet.uni-hamburg.de; Wiesendanger, R. [Institut für Angewandte Physik, Universität Hamburg, Jungiusstrasse 11, 20355 Hamburg (Germany); Bakhtiari, M. R.; Thorwart, M. [I. Institut für Theoretische Physik, Universität Hamburg, Jungiusstrae 9, 20355 Hamburg (Germany)

    2015-03-23

    The sensitivity of atomic force microscopes is fundamentally limited by the cantilever temperature, which can be, in principle, determined by measuring its thermal spectrum and applying the equipartition theorem. However, the mechanical response can be affected by the light field inside the cavity of a Fabry-Perot interferometer due to light absorption, radiation pressure, photothermal forces, and laser noise. By evaluating the optomechanical Hamiltonian, we are able to explain the peculiar distance dependence of the mechanical quality factor as well as the appearance of thermal spectra with symmetrical Lorentzian as well as asymmetrical Fano line shapes. Our results can be applied to any type of mechanical oscillator in an interferometer-based detection system.

  7. Observation of irreversible current path in polymer dielectric using conductive atomic force microscope

    Science.gov (United States)

    Jung, Ji-Hoon; Kim, Woo Young; Kim, Do-Kyung; Kwon, Jin-Hyuk; Lee, Hee Chul; Bae, Jin-Hyuk

    2015-03-01

    During the measurement of the electrical properties of a metal-polymer-metal capacitor, it was found that the capacitor exhibited write-once-read-many-times (WORM) memory behavior, even though it was made of the dielectric polymer, polystyrene. The initial low conductance state changed to a high conductance state when a threshold voltage was applied, but this final state never reverted to the initial state. This phenomenon only appeared in sub-100-nm-thick films. To understand this phenomenon, conductive atomic force microscopy (CAFM) was used. The current distribution measured with CAFM showed an irreversible current path had formed near particles in the polymer film. For reproducibility, particles were intentionally inserted into the polymer film during the fabrication of metal-polymer-metal capacitors, and the same current mechanism was found. From these results, it is concluded that the purification and cleaning process of organic devices severely affects the device characteristics. In addition, particle-insertion appears to be a promising method for fabrication low-cost and air-stable WORM type memory for various applications. [Figure not available: see fulltext.

  8. Set-up of a high-resolution 300 mK atomic force microscope in an ultra-high vacuum compatible (3)He/10 T cryostat.

    Science.gov (United States)

    von Allwörden, H; Ruschmeier, K; Köhler, A; Eelbo, T; Schwarz, A; Wiesendanger, R

    2016-07-01

    The design of an atomic force microscope with an all-fiber interferometric detection scheme capable of atomic resolution at about 500 mK is presented. The microscope body is connected to a small pumped (3)He reservoir with a base temperature of about 300 mK. The bakeable insert with the cooling stage can be moved from its measurement position inside the bore of a superconducting 10 T magnet into an ultra-high vacuum chamber, where the tip and sample can be exchanged in situ. Moreover, single atoms or molecules can be evaporated onto a cold substrate located inside the microscope. Two side chambers are equipped with standard surface preparation and surface analysis tools. The performance of the microscope at low temperatures is demonstrated by resolving single Co atoms on Mn/W(110) and by showing atomic resolution on NaCl(001). PMID:27475560

  9. Set-up of a High-Resolution 300 mK Atomic Force Microscope in an Ultra-High Vacuum Compatible 3He/10T Cryostat

    CERN Document Server

    von Allwörden, Henning; Köhler, Arne; Eelbo, Thomas; Schwarz, Alexander; Wiesendanger, Roland

    2016-01-01

    The design of an atomic force microscope with an all-fiber interferometric detection scheme capable of atomic resolution at about 500 mK is presented. The microscope body is connected to a small pumped 3He reservoir with a base temperature of about 300 mK. The bakeable insert with the cooling stage can be moved from its measurement position inside the bore of a superconducting 10 T magnet into an ultra-high vacuum chamber, where tip and sample can be exchanged in-situ. Moreover, single atoms or molecules can be evaporated onto a cold substrate located inside the microscope. Two side chambers are equipped with standard surface preparation and surface analysis tools. The performance of the microscope at low temperatures is demonstrated by resolving single Co atoms on Mn/W(110) and by showing atomic resolution on NaCl(001).

  10. Set-up of a high-resolution 300 mK atomic force microscope in an ultra-high vacuum compatible 3He/10 T cryostat

    Science.gov (United States)

    von Allwörden, H.; Ruschmeier, K.; Köhler, A.; Eelbo, T.; Schwarz, A.; Wiesendanger, R.

    2016-07-01

    The design of an atomic force microscope with an all-fiber interferometric detection scheme capable of atomic resolution at about 500 mK is presented. The microscope body is connected to a small pumped 3He reservoir with a base temperature of about 300 mK. The bakeable insert with the cooling stage can be moved from its measurement position inside the bore of a superconducting 10 T magnet into an ultra-high vacuum chamber, where the tip and sample can be exchanged in situ. Moreover, single atoms or molecules can be evaporated onto a cold substrate located inside the microscope. Two side chambers are equipped with standard surface preparation and surface analysis tools. The performance of the microscope at low temperatures is demonstrated by resolving single Co atoms on Mn/W(110) and by showing atomic resolution on NaCl(001).

  11. Sensitivity analysis of rectangular atomic force microscope cantilevers immersed in liquids based on the modified couple stress theory.

    Science.gov (United States)

    Lee, Haw-Long; Chang, Win-Jin

    2016-01-01

    The modified couple stress theory is adopted to study the sensitivity of a rectangular atomic force microscope (AFM) cantilever immersed in acetone, water, carbon tetrachloride (CCl4), and 1-butanol. The theory contains a material length scale parameter and considers the size effect in the analysis. However, this parameter is difficult to obtain via experimental measurements. In this study, a conjugate gradient method for the parameter estimation of the frequency equation is presented. The optimal method provides a quantitative approach for estimating the material length scale parameter based on the modified couple stress theory. The results show that the material length scale parameter of the AFM cantilever immersed in acetone, CCl4, water, and 1-butanol is 0, 25, 116.3, and 471 nm, respectively. In addition, the vibration sensitivities of the AFM cantilever immersed in these liquids are investigated. The results are useful for the design of AFM cantilevers immersed in liquids.

  12. A new type of horizontal atomic force microscope%卧式原子力显微镜的研制

    Institute of Scientific and Technical Information of China (English)

    张冬仙; 黄峰

    2001-01-01

    提出原子力显微镜(AFM)的新设计,讨论卧式AFM的工作原理及其性能特点,简要介绍AFM的控制电路系统及其图像扫描和图像处理软件系统,给出AFM扫描获得的部分样品的图像结果。%A new design of horizontal atomic force microscope(AFM)was developed.The principle and characteristics of the new horizontal AFM were discussed.The control circuits and software systems for image scanning and processing were introduced.Some experimental results of image acquisition by using the horizontal AFM were also presented

  13. The multi-position calibration of the stiffness for atomic-force microscope cantilevers based on vibration

    International Nuclear Information System (INIS)

    Calibration of the stiffness of atomic force microscope (AFM) cantilevers is critical for industry and academic research. The multi-position calibration method for AFM cantilevers based on vibration is investigated. The position providing minimum uncertainty is deduced. The validity of the multi-position approach is shown via theoretical and experimental means. We applied it to the recently developed vibration method using an AFM cantilever with a normal stiffness of 0.1 N m−1. The standard deviation of the measured stiffness is 0.002 N m−1 with a mean value of 0.189 N m−1 and the relative combined uncertainty is approximately 7%, which is better than the approach using the single position at the tip of the cantilever. (paper)

  14. Fabrication of ionic liquid thin film by nano-inkjet printing method using atomic force microscope cantilever tip

    International Nuclear Information System (INIS)

    We demonstrate the fabrication of thin films of ionic liquid (IL), 1-butyl-3-methyl-imidazolium tetrafluoborate, by nano-inkjet printing method using an atomic force microscope (AFM) cantilever. The IL filled in a pyramidal hollow of the AFM cantilever tip was extracted from an aperture at the bottom of the hollow and deposited onto a Pt substrate when the bias voltage was applied between the cantilever and the substrate. We succeeded in fabricating IL thin films with a thickness of 4 nm. The areas and thicknesses of IL thin films were controlled by the fabrication conditions in this method, which is also useful for the investigations of nanometer-scale properties of ionic liquid.

  15. Note: Fabrication of a fast-response and user-friendly environmental chamber for atomic force microscopes

    Energy Technology Data Exchange (ETDEWEB)

    Ji, Yanfeng; Hui, Fei; Shi, Yuanyuan; Han, Tingting; Song, Xiaoxue; Pan, Chengbin; Lanza, Mario, E-mail: mlanza@suda.edu.cn [Institute of Functional Nano & Soft Materials, Soochow University, Collaborative Innovation Center of Suzhou Nano Science & Technology, 199 Ren-Ai Road, Suzhou 215123 (China)

    2015-10-15

    The atomic force microscope is one of the most widespread tools in science, but many suppliers do not provide a competitive solution to make experiments in controlled atmospheres. Here, we provide a solution to this problem by fabricating a fast-response and user-friendly environmental chamber. We corroborate the correct functioning of the chamber by studying the formation of local anodic oxidation on a silicon sample (biased under opposite polarities), an effect that can be suppressed by measuring in a dry nitrogen atmosphere. The usefulness of this chamber goes beyond the example here presented, and it could be used in many other fields of science, including physics, mechanics, microelectronics, nanotechnology, medicine, and biology.

  16. Track core size estimation in CR-39 track detector using atomic force microscope and UV-visible spectrophotometer

    International Nuclear Information System (INIS)

    The radial size of track cores in CR-39 plastics for several types of ions has been determined by two different methods. First, atomic force microscope observations were performed on the irradiated CR-39 subsequent to the slight chemical etchings. The track core radii for C, O, Ne and Xe ions evaluated from the intersections of the extrapolated lines, fitted to each growth curve of etch pit radius, were found to be in the range between 2.8 and 4.1 nm, independent of the ion species. Second, UV-visible spectra of the irradiated CR-39 were obtained at various fluences. Based on a track overlapping model, the track core radii are evaluated for H, He, C and O ions. Their core radii were almost proportional to the cube root of the stopping power. The results from the two different measurements are in good agreement with each other

  17. A novel atomic force microscope operating in liquid with open probe unit and optimized laser tracking system

    Institute of Scientific and Technical Information of China (English)

    Xia Fu; Dongxian Zhang; Haijun Zhang

    2009-01-01

    A novel atomic force microscope (AFM) for large samples to be measured in liquid is developed.An innovative laser beam tracking system is proposed to eliminate the tracking and feedback errors.The open probe design of the AFM makes the operation in liquid convenient and easy.A standard 1200-lines/mm grating and a sheet of filter paper are imaged respectively in air and liquid to confirm its performance.The corrosion behavior of aluminum surface in 1-mol/L NaOH solution is further investigated by the AFM.Experimental results show that the system can realize wide range (20 × 20 (μm)) scanning for large samples both in air and liquid,while keeping nanometer order resolution in liquid by eliminating the tracking and feedback error.

  18. MM99.50 - Surface Topography Characterization Using an Atomic Force Microscope Mounted on a Coordinate Measuring Machine

    DEFF Research Database (Denmark)

    Chiffre, Leonardo De; Hansen, Hans Nørgaard; Kofod, Niels

    1999-01-01

    The paper describes the construction, testing and use of an integrated system for topographic characterization of fine surfaces on parts having relatively big dimensions. An atomic force microscope (AFM) was mounted on a manual three-coordinate measuring machine (CMM) achieving free positioning...... values in the order of 1 nm. The positioning repeatability of the two horizontal axes of the CMM was determined to +/-1 mu m. Sets of four 20 mu m x 20 mu m areas were traced on fiat objects, combining the data into single 40 mu m x 40 mu m areas, and comparing the roughness values to those for the same...... areas traced in single scans of 40 mu m x 40 mu m. The results show that surface mapping on industrial surfaces is possible using the Least Mean Square alignment provided by the AFM software....

  19. A single-cell scraper based on an atomic force microscope for detaching a living cell from a substrate

    Energy Technology Data Exchange (ETDEWEB)

    Iwata, Futoshi, E-mail: iwata.futoshi@shizuoka.ac.jp [Department of Mechanical Engineering, Faculty of Engineering, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8561 (Japan); Research Institute of Electronics, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8011 (Japan); Adachi, Makoto; Hashimoto, Shigetaka [Department of Mechanical Engineering, Faculty of Engineering, Shizuoka University, Johoku, Naka-ku, Hamamatsu 432-8561 (Japan)

    2015-10-07

    We describe an atomic force microscope (AFM) manipulator that can detach a single, living adhesion cell from its substrate without compromising the cell's viability. The micrometer-scale cell scraper designed for this purpose was fabricated from an AFM micro cantilever using focused ion beam milling. The homemade AFM equipped with the scraper was compact and standalone and could be mounted on a sample stage of an inverted optical microscope. It was possible to move the scraper using selectable modes of operation, either a manual mode with a haptic device or a computer-controlled mode. The viability of the scraped single cells was evaluated using a fluorescence dye of calcein-acetoxymethl ester. Single cells detached from the substrate were collected by aspiration into a micropipette capillary glass using an electro-osmotic pump. As a demonstration, single HeLa cells were selectively detached from the substrate and collected by the micropipette. It was possible to recultivate HeLa cells from the single cells collected using the system.

  20. A single-cell scraper based on an atomic force microscope for detaching a living cell from a substrate

    Science.gov (United States)

    Iwata, Futoshi; Adachi, Makoto; Hashimoto, Shigetaka

    2015-10-01

    We describe an atomic force microscope (AFM) manipulator that can detach a single, living adhesion cell from its substrate without compromising the cell's viability. The micrometer-scale cell scraper designed for this purpose was fabricated from an AFM micro cantilever using focused ion beam milling. The homemade AFM equipped with the scraper was compact and standalone and could be mounted on a sample stage of an inverted optical microscope. It was possible to move the scraper using selectable modes of operation, either a manual mode with a haptic device or a computer-controlled mode. The viability of the scraped single cells was evaluated using a fluorescence dye of calcein-acetoxymethl ester. Single cells detached from the substrate were collected by aspiration into a micropipette capillary glass using an electro-osmotic pump. As a demonstration, single HeLa cells were selectively detached from the substrate and collected by the micropipette. It was possible to recultivate HeLa cells from the single cells collected using the system.

  1. Set-up of a High-Resolution 300 mK Atomic Force Microscope in an Ultra-High Vacuum Compatible 3He/10T Cryostat

    OpenAIRE

    von Allwörden, Henning; Ruschmeier, Kai; Köhler, Arne; Eelbo, Thomas; Schwarz, Alexander; Wiesendanger, Roland

    2016-01-01

    The design of an atomic force microscope with an all-fiber interferometric detection scheme capable of atomic resolution at about 500 mK is presented. The microscope body is connected to a small pumped 3He reservoir with a base temperature of about 300 mK. The bakeable insert with the cooling stage can be moved from its measurement position inside the bore of a superconducting 10 T magnet into an ultra-high vacuum chamber, where tip and sample can be exchanged in-situ. Moreover, single atoms ...

  2. Novel thin membrane probe and a new twisting modulation force detection method of an atomic force microscope

    Science.gov (United States)

    Nakano, Katsushi; Suzuki, Yoshihiko

    1999-04-01

    For inspection of high aspect ratio structures like narrow semiconductor trenches, a thin membrane probe and a new force detection method have been proposed. Instead of conventional conical and pyramidal tips, a thin silicon nitride cantilever was set up vertically, and its edge was used as a tip. The membrane probe named as twist-probe (TP) was oscillated in the twisting resonance to detect a force from both vertical and lateral directions. About 100 μm long, 0.7 μm thick TP was fabricated as a trial. Amplitude versus distance curve measurements showed that the TP has a high spacing change sensitivity between the tip and a sample in both vertical and lateral directions. A trench cross-section imaging was demonstrated successfully with a TP and the twist resonant force detection method.

  3. Nanometer-scale manipulator and ultrasonic cutter using an atomic force microscope controlled by a haptic device

    Science.gov (United States)

    Iwata, F.; Kawanishi, S.; Sasaki, A.; Aoyama, H.; Ushiki, T.

    2008-10-01

    We describe a nanometer-scale manipulatoion and cutting method using ultrasonic oscillation scratching. The system is based on a modified atomic force microscope (AFM) coupled with a haptic device as a human interface. By handling the haptic device, the operator can directly move the AFM probe to manipulate nanometer scale objects and cut a surface while feeling the reaction from the surface in his or her fingers. As for manipulation using the system, nanometer-scale spheres were controllably moved by feeling the sensation of the AFM probe touching the spheres. As for cutting performance, the samples were prepared on an AT-cut quartz crystal resonator (QCR) set on an AFM sample holder. The QCR oscillates at its resonance frequency (9 MHz) with an amplitude of a few nanometers. Thus it is possible to cut the sample surface smoothly by the interaction between the AFM probe and the oscillating surface, even when the samples are viscoelastics such as polymers and biological samples. The ultrasonic nano-manipulation and cutting system would be a very useful and effective tool in the fields of nanometer-scale engineering and biological sciences.

  4. A miniaturized, high frequency mechanical scanner for high speed atomic force microscope using suspension on dynamically determined points

    Energy Technology Data Exchange (ETDEWEB)

    Herfst, Rodolf; Dekker, Bert; Witvoet, Gert; Crowcombe, Will; Lange, Dorus de [Department of Optomechatronics, Netherlands Organization for Applied Scientific Research, TNO, Delft (Netherlands); Sadeghian, Hamed, E-mail: hamed.sadeghianmarnani@tno.nl, E-mail: h.sadeghianmarnani@tudelft.nl [Department of Optomechatronics, Netherlands Organization for Applied Scientific Research, TNO, Delft (Netherlands); Department of Precision and Microsystems Engineering, Delft University of Technology, Delft (Netherlands)

    2015-11-15

    One of the major limitations in the speed of the atomic force microscope (AFM) is the bandwidth of the mechanical scanning stage, especially in the vertical (z) direction. According to the design principles of “light and stiff” and “static determinacy,” the bandwidth of the mechanical scanner is limited by the first eigenfrequency of the AFM head in case of tip scanning and by the sample stage in terms of sample scanning. Due to stringent requirements of the system, simply pushing the first eigenfrequency to an ever higher value has reached its limitation. We have developed a miniaturized, high speed AFM scanner in which the dynamics of the z-scanning stage are made insensitive to its surrounding dynamics via suspension of it on specific dynamically determined points. This resulted in a mechanical bandwidth as high as that of the z-actuator (50 kHz) while remaining insensitive to the dynamics of its base and surroundings. The scanner allows a practical z scan range of 2.1 μm. We have demonstrated the applicability of the scanner to the high speed scanning of nanostructures.

  5. Efficient field emission from α-Fe2O3 nanoflakes on an atomic force microscope tip

    Science.gov (United States)

    Zhu, Y. W.; Yu, T.; Sow, C. H.; Liu, Y. J.; Wee, A. T. S.; Xu, X. J.; Lim, C. T.; Thong, J. T. L.

    2005-07-01

    Aligned arrays of flake-shaped hematite (α-Fe2O3) nanostructure have been fabricated on an atomic force microscope (AFM) tip. They are created by simply heating an iron-coated AFM tip in ambience on a hot plate. These nanoflakes are characterized as α-Fe2O3 single crystalline structures with tip radii as small as several nanometers and are highly effective as electron field emitters. With a vacuum gap of about 150μm, field emission measurements of α-Fe2O3 nanoflakes on AFM tips show a low turn-on voltage of about 400-600V and a high current density of 1.6Acm-2 under 900V. Such high emission current density is attributed to the nanoscale sharp tips of the as-grown nanoflakes. Based on the Fowler-Nordheim theory, it is demonstrated the enhancement factor of α-Fe2O3 nanoflakes on AFM tips is comparable to that of carbon nanotubes. Our findings suggest that α-Fe2O3 nanoflakes are potentially useful as candidates for future electron field emission devices.

  6. Experimental Investigation on Mechanical and Surface Properties of Cr3-C2 Composite coating Using Atomic Force Microscope

    Directory of Open Access Journals (Sweden)

    P.S. HANUMANTA RAO

    2011-08-01

    Full Text Available Chromium Carbide composite coating has been the subject of interest in the area of nano material due to the improvement in mechanical properties when grain sizes reduce to nanometer scale.. Composite coating of chromium carbide has used in integrated printed circuit boards (PCBs, pins for dot-printers, corrosion resistance and other wear resistant parts. The present work to determine the mechanical properties Young’s modulus and hardness, surface properties surface roughness, surface topology. An Atomic Force Microscope (AFM equipped with a SiN cantilever is used to scratch the surface of Cr3-C2 (75-25% coating deposited on an Aluminium substrate by a process called Nano scratching. During nanoscratching the sample is scratched and indented through few nanometers depth. The sample has been prepared by the detonation gun spray process. The property of the coated sample is measured in contact mode by AFM. The investigation revealed that the addition of Carbide to Cr is not only changing the topology but also the mechanical properties. The averagemeasured values of Young’s modulus and hardness of Cr3-C2 (75-25% coated sample is in the range of 583.27k Pa and 123.81k Pa.

  7. Atomic Force Microscope Spectroscopy Reveals a Hemifusion Intermediate during Soluble N-Ethylmaleimide-Sensitive Factor-Attachment Protein Receptors-Mediated Membrane Fusion

    OpenAIRE

    Abdulreda, Midhat H.; Bhalla, Akhil; Chapman, Edwin R.; Moy, Vincent T.

    2007-01-01

    This study investigated the effect of soluble N-ethylmaleimide-sensitive factor-attachment protein (SNAP) receptors (SNAREs) on the fusion of egg L-α-phosphatidylcholine bilayers using atomic force microscope (AFM) spectroscopy. AFM measurements of the fusion force under compression were acquired to reveal the energy landscape of the fusion process. A single main energy barrier governing the fusion process was identified in the absence and presence of SNAREs in the bilayers. Under compression...

  8. Development of High-Speed Copper Chemical Mechanical Polishing Slurry for Through Silicon Via Application Based on Friction Analysis Using Atomic Force Microscope

    Science.gov (United States)

    Amanokura, Jin; Ono, Hiroshi; Hombo, Kyoko

    2011-05-01

    In order to obtain a high-speed copper chemical mechanical polishing (CMP) process for through silicon vias (TSV) application, we developed a new Cu CMP slurry through friction analysis of Cu reaction layer by an atomic force microscope (AFM) technique. A lateral modulation friction force microscope (LM-FFM) is able to measure the friction value properly giving a vibration to the layer. We evaluated the torsional displacement between the probe of the LM-FFM and the Cu reaction layer under a 5 nm vibration to cancel the shape effect of the Cu reaction layer. The developed Cu CMP slurry forms a frictionally easy-removable Cu reaction layer.

  9. Electrical conductivity in Langmuir-Blodgett films of n-alkyl cyanobiphenyls using current sensing atomic force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Gayathri, H. N.; Suresh, K. A., E-mail: suresh@cnsms.res.in [Centre for Nano and Soft Matter Sciences, P. B. No. 1329, Jalahalli, Bangalore 560013 (India)

    2015-06-28

    We report our studies on the nanoscale electrical conductivity in monolayers of n-alkyl cyanobiphenyl materials deposited on solid surface. Initially, the 8CB, 9CB, and 10CB monolayer films were prepared by the Langmuir technique at air-water interface and characterized by surface manometry and Brewster angle microscopy. The monolayer films were transferred on to solid substrates by the Langmuir-Blodgett (L-B) technique. The 8CB, 9CB, and 10CB monolayer L-B films were deposited on freshly cleaved mica and studied by atomic force microscope (AFM), thereby measuring the film thickness as ∼1.5 nm. The electrical conductivity measurements were carried out on 9CB and 10CB monolayer L-B films deposited onto highly ordered pyrolytic graphite using current sensing AFM. The nanoscale current-voltage (I-V) measurements show a non-linear variation. The nature of the curve indicates electron tunneling to be the mechanism for electrical conduction. Furthermore, analysis of the I-V curve reveals a transition in the electron conduction mechanism from direct tunneling to injection tunneling. From the transition voltage, we have estimated the values of barrier height for 9CB and 10CB to be 0.71 eV and 0.37 eV, respectively. For both 9CB and 10CB, the effective mass of electron was calculated to be 0.021 m{sub e} and 0.065 m{sub e}, respectively. These parameters are important in the design of molecular electronic devices.

  10. High-speed spiral imaging technique for an atomic force microscope using a linear quadratic Gaussian controller

    International Nuclear Information System (INIS)

    This paper demonstrates a high-speed spiral imaging technique for an atomic force microscope (AFM). As an alternative to traditional raster scanning, an approach of gradient pulsing using a spiral line is implemented and spirals are generated by applying single-frequency cosine and sine waves of slowly varying amplitudes to the X and Y-axes of the AFM’s piezoelectric tube scanner (PTS). Due to these single-frequency sinusoidal input signals, the scanning process can be faster than that of conventional raster scanning. A linear quadratic Gaussian controller is designed to track the reference sinusoid and a vibration compensator is combined to damp the resonant mode of the PTS. An internal model of the reference sinusoidal signal is included in the plant model and an integrator for the system error is introduced in the proposed control scheme. As a result, the phase error between the input and output sinusoids from the X and Y-PTSs is reduced. The spirals produced have particularly narrow-band frequency measures which change slowly over time, thereby making it possible for the scanner to achieve improved tracking and continuous high-speed scanning rather than being restricted to the back and forth motion of raster scanning. As part of the post-processing of the experimental data, a fifth-order Butterworth filter is used to filter noises in the signals emanating from the position sensors and a Gaussian image filter is used to filter the images. A comparison of images scanned using the proposed controller (spiral) and the AFM PI controller (raster) shows improvement in the scanning rate using the proposed method

  11. High-speed spiral imaging technique for an atomic force microscope using a linear quadratic Gaussian controller

    Science.gov (United States)

    Habibullah, H.; Pota, H. R.; Petersen, I. R.

    2014-03-01

    This paper demonstrates a high-speed spiral imaging technique for an atomic force microscope (AFM). As an alternative to traditional raster scanning, an approach of gradient pulsing using a spiral line is implemented and spirals are generated by applying single-frequency cosine and sine waves of slowly varying amplitudes to the X and Y-axes of the AFM's piezoelectric tube scanner (PTS). Due to these single-frequency sinusoidal input signals, the scanning process can be faster than that of conventional raster scanning. A linear quadratic Gaussian controller is designed to track the reference sinusoid and a vibration compensator is combined to damp the resonant mode of the PTS. An internal model of the reference sinusoidal signal is included in the plant model and an integrator for the system error is introduced in the proposed control scheme. As a result, the phase error between the input and output sinusoids from the X and Y-PTSs is reduced. The spirals produced have particularly narrow-band frequency measures which change slowly over time, thereby making it possible for the scanner to achieve improved tracking and continuous high-speed scanning rather than being restricted to the back and forth motion of raster scanning. As part of the post-processing of the experimental data, a fifth-order Butterworth filter is used to filter noises in the signals emanating from the position sensors and a Gaussian image filter is used to filter the images. A comparison of images scanned using the proposed controller (spiral) and the AFM PI controller (raster) shows improvement in the scanning rate using the proposed method.

  12. High-speed broadband nanomechanical property quantification and imaging of life science materials using atomic force microscope

    Science.gov (United States)

    Ren, Juan

    Nanoscale morphological characterization and mechanical properties quantification of soft and biological materials play an important role in areas ranging from nano-composite material synthesis and characterization, cellular mechanics to drug design. Frontier studies in these areas demand the coordination between nanoscale morphological evolution and mechanical behavior variations through simultaneous measurement of these two aspects of properties. Atomic force microscope (AFM) is very promising in achieving such simultaneous measurements at high-speed and broadband owing to its unique capability in applying force stimuli and then, measuring the response at specific locations in a physiologically friendly environment with pico-newton force and nanometer spatial resolution. Challenges, however, arise as current AFM systems are unable to account for the complex and coupled dynamics of the measurement system and probe-sample interaction during high-speed imaging and broadband measurements. In this dissertation, the creation of a set of dynamics and control tools to probe-based high-speed imaging and rapid broadband nanomechanical spectroscopy of soft and biological materials are presented. Firstly, advanced control-based approaches are presented to improve the imaging performance of AFM imaging both in air and in liquid. An adaptive contact mode (ACM) imaging scheme is proposed to replace the traditional contact mode (CM) imaging by addressing the major concerns in both the speed and the force exerted to the sample. In this work, the image distortion caused by the topography tracking error is accounted for in the topography quantification and the quantified sample topography is utilized in a gradient-based optimization method to adjust the cantilever deflection set-point for each scanline closely around the minimal level needed for maintaining a stable probe-sample contact, and a data-driven iterative feedforward control that utilizes a prediction of the next

  13. Analysis of beam interference reflected from atomic force microscope tip and periodic silicon surface under various humidity conditions

    Science.gov (United States)

    Banerjee, Hans P.; Weerasinghe, Asanka T.; Lyuksyutov, Sergei F.

    2012-10-01

    Dynamical sensing based on combination of classical optical effects and atomic force microscopy (AFM) presents challenge for analysis of the forces at the nanoscale and beyond. An interference effect between light reflected from an AFM cantilever and highly reflective silicon surface of the calibration grating was studied for relative humidity (RH) varied between 9 and 60%. Force-distance analysis indicates on separation of capillary, van der Waals, adhesion, and electrostatic forces. The measurements performed in contact AFM mode suggest that the period of interference pattern observed in displacement curves is a function of humidity and varies between 293 nm at RH = 9% and 335 nm at RH > 50% with standard deviation less than 8 nm. Clear change of the interference period suggests that other than hardwarerelated factors may be involved in the formation of the interference in force-distance curves.

  14. Fabrication of amorphous silicon nanoribbons by atomic force microscope tip induced local oxidation for thin film device applications

    OpenAIRE

    Pichon, Laurent; Rogel, Regis; Demami, Fouad

    2010-01-01

    WOS International audience We demonstrate the feasibility of induced local oxidation of amorphous silicon by atomic force microscopy. The resulting local oxide is used as mask for the elaboration of thin film silicon resistor. A thin amorphous silicon layer deposited on a glass substrate is locally oxidized following narrow continuous lines. The corresponding oxide line is then used as mask during plasma etching of the amorphous layer leading to the formation of nanoribbon. Such amorpho...

  15. Bringing light into the nano-world: What can you do with an atomic force microscope on top of your synchrotron radiation sample holder?

    International Nuclear Information System (INIS)

    This thesis had as a major objective to combine scanning probe microscopy in particular, atomic force microscopy with synchrotron light spectroscopies. The combination of these two types of spectroscopies is meant to be in-situ and in real time. Thus this thesis aimed at introducing new types of experimental techniques suitable for the investigation of nano-sized materials. The proposed new instrumentation, would provide chemical-specific contrast at unprecedented lateral resolution of up to 10-40 nanometers, thus overcoming existing limitations of the two families of spectroscopy methods and opening a wide range of research opportunities and challenges. For the purpose of combining these techniques an atomic force microscope was developed. The atomic force microscope (AFM) was developed around a quartz tuning fork crystal which was used as the sensor with which atomic forces are detected. The developed AFM was then used in several beam lines with essentially two different purposes. A first goal was to do spectroscopy, such as the measurement of an absorption edge, locally with the tip of the AFM. Such measurements were indeed done, but the lateral resolution is still dominated by the X-ray beam size rather than by the tip apex shape. The AFM tip was also used to measure Bragg peaks from crystals with sizes on the nanometer scale. A second goal was to use the AFM as an instrument to mechanical interact with nano-sized systems while the X-ray beam was used to probe changes in the lattice parameter of the studied systems. Thus the AFM tip was used to elastically indent a SiGe crystal while diffraction was simultaneously measured. It was possible to observe shifts of the Bragg peak as a consequence of the applied pressure. The in-situ combination of AFM with synchrotron light permitted, in this way, to measure the Young modulus of a crystal at the nano-scale without any kind of adjustable parameter. (author)

  16. 原子力显微镜在生命科学中的应用%The application of atomic force microscope in life science

    Institute of Scientific and Technical Information of China (English)

    曾洁铭; 曾耀英; 蔡继业; 肇静娴

    2001-01-01

    During the past few years, atomic force microscope (AFM) isbecoming a powerful tool in life science research. With their high-resolution and capability to image under aqueous solution, AFM is applied to investigate the structure of biomolecules and biological process in real time. From visualization of DNA and IgG to DNA transcription, the advances in sample preparation methods have made these events come true. In addition, AFM can be used in molecular recognition. This article illustrates these major achievements of AFM in biological studies.

  17. Coffee Cup Atomic Force Microscopy

    Science.gov (United States)

    Ashkenaz, David E.; Hall, W. Paige; Haynes, Christy L.; Hicks, Erin M.; McFarland, Adam D.; Sherry, Leif J.; Stuart, Douglas A.; Wheeler, Korin E.; Yonzon, Chanda R.; Zhao, Jing; Godwin, Hilary A.; Van Duyne, Richard P.

    2010-01-01

    In this activity, students use a model created from a coffee cup or cardstock cutout to explore the working principle of an atomic force microscope (AFM). Students manipulate a model of an AFM, using it to examine various objects to retrieve topographic data and then graph and interpret results. The students observe that movement of the AFM…

  18. Research on a Diamond Tip Wear Mechanism in Atomic Force Microscope-based Micro/nano-machining

    Institute of Scientific and Technical Information of China (English)

    2001-01-01

    The object is to investigate the wear of an atomic forcemicroscope (AFM) diamond tip when conducting micro/nano-machining on single crystal silicon surface. The experimental research and theoretical analysis were carried out on the worn tip in terms of wear rate, wear mechanism and the effect of the tip wear on micro-machining process. The wear rate was calculated as 1.7(10~10mm3/(N*m) by using a theoretical model combined with the experimental results. Through an integration of an AFM observation on the worn tip features with the FEM simulation of the stress distribution, in addition to the unit cutting force calculation on the AFM diamond tip, the wear mechanism of the AFM diamond tip was concluded as mainly chemical wear, and the wear process was also elaborated as well.

  19. Si2Sb2Te5 phase change material studied by an atomic force microscope nano-tip

    Institute of Scientific and Technical Information of China (English)

    Liu Yanbo; Zhang Ting; Niu Xiaoming; Song Zhitang; Min Guoquan; Zhang Jing; Zhou Weimin; Wan Yongzhong; Zhang Jianping; Li Xiaoli; Feng Songlin

    2009-01-01

    The Si2Sb2Te5 phase change material has been studied by applying a nano-tip (30 nm in diameter) on an atomic force microscopy system. Memory switching from a high resistance state to a low resistance state has been achieved, with a resistance change of about 1000 times. In a typical Ⅰ-Ⅴ curve, the current increases significantly after the voltage exceeds~4.3 V. The phase transformation of a Si2Sb2Te5 film was studied in situ by means of in situ X-ray diffraction and temperature dependent resistance measurements. The thermal stability of Si2Sb2Te5 and Ge2Sb2Te5 was characterized and compared as well.

  20. Formation and characterization of thin films from phthalocyanine complexes: An electrosynthesis study using the atomic-force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Sanchez Vergara, M.E. [Departamento de Ingenieria Mecatronica, Escuela de Ingenieria, Universidad Anahuac del Norte, Avenida Lomas de la Anahuac s/n, Col. Lomas Anahuac, 52786, Huixquilucan (Mexico)]. E-mail: elena.sanchez@anahuac.mx; Islas Bernal, I.F. [Instituto de Fisica, Universidad Nacional Autonoma de Mexico, Circuito Exterior, Ciudad Universitaria, 04510, Mexico D.F. (Mexico); Rivera, M. [Instituto de Fisica, Universidad Nacional Autonoma de Mexico, Circuito Exterior, Ciudad Universitaria, 04510, Mexico D.F. (Mexico); Ortiz Rebollo, A. [Instituto de Investigaciones en Materiales, Universidad Nacional Autonoma de Mexico, A.P. 70-360, Coyoacan, 04510, Mexico, D.F. (Mexico); Alvarez Bada, J.R. [Instituto Tecnologico y de Estudios Superiores de Monterrey, Campus Ciudad de Mexico, Calle del Puente 222, Col. Ejidos de Huipulco, 14380, Mexico D.F. (Mexico)

    2007-05-07

    ({mu}-Cyano)(phthalocyaninato)metal(III) [PcMCN]{sub n} species with a central transition metal ion, such as Fe(III) and Co(III), were used to prepare molecular films on a highly oriented pyrolytic graphite electrode substrate by using the cyclic voltammetry technique. In order to investigate the influence of the ligand on the film properties, 1,8-dihydroxyanthraquinone and 2,6-dihydroxyanthraquinone as bivalent ligands were employed. The structure of the molecular materials was analyzed by infrared spectroscopy. The in situ film formation, texture, composition and conductivity of each film were further investigated using atomic force microscopy, scanning electron microscopy, energy-dispersive X-ray spectroscopy and the four-probe technique, respectively. The [PcMCN]{sub n} complexes provided conductive films with an electrical conductivity of 1 x 10{sup -6} {omega}{sup -1} cm{sup -1} at 298 K.

  1. Formation and characterization of thin films from phthalocyanine complexes: An electrosynthesis study using the atomic-force microscope

    International Nuclear Information System (INIS)

    (μ-Cyano)(phthalocyaninato)metal(III) [PcMCN]n species with a central transition metal ion, such as Fe(III) and Co(III), were used to prepare molecular films on a highly oriented pyrolytic graphite electrode substrate by using the cyclic voltammetry technique. In order to investigate the influence of the ligand on the film properties, 1,8-dihydroxyanthraquinone and 2,6-dihydroxyanthraquinone as bivalent ligands were employed. The structure of the molecular materials was analyzed by infrared spectroscopy. The in situ film formation, texture, composition and conductivity of each film were further investigated using atomic force microscopy, scanning electron microscopy, energy-dispersive X-ray spectroscopy and the four-probe technique, respectively. The [PcMCN]n complexes provided conductive films with an electrical conductivity of 1 x 10-6 Ω-1 cm-1 at 298 K

  2. Direct method for magnetostriction coefficient measurement based on atomic force microscope, illustrated by the example of Tb–Co film

    Energy Technology Data Exchange (ETDEWEB)

    Lima, B.L.S. [Laboratório de Sensores Óticos, Escola Politécnica, Universidade de São Paulo, SP (Brazil); Maximino, F.L. [Laboratório de Materiais Magnéticos, Instituto de Física, Universidade de São Paulo, CEP:05314-970 São Paulo, SP (Brazil); Santos, J.C. [Laboratório de Sensores Óticos, Escola Politécnica, Universidade de São Paulo, SP (Brazil); Santos, A.D., E-mail: adsantos@if.usp.br [Laboratório de Materiais Magnéticos, Instituto de Física, Universidade de São Paulo, CEP:05314-970 São Paulo, SP (Brazil)

    2015-12-01

    This paper presents a method based on the Atomic Force Microscopy technique for direct measurement of magnetostriction coefficient of amorphous Tb–Co films deposited on Si(100) substrate. The magnetostriction coefficient of the film is determined by AFM measuring the deflection of the sample when applying a magnetic field. In order to maximize the deflection of the sample, in-plane magnetic anisotropy was induced by heat treatment under a magnetic field of 5 kOe. The value obtained for the saturation magnetostriction is 204×10{sup −6} for the Tb{sub 23}Co{sub 77} film. - Highlights: • Measurement of magnetostriction coefficient using AFM. • Tb–Co thin films produced by magnetron sputtering. • Magnetostriction characterization of magnetic thin films on nonmagnetic substrates.

  3. The relationship between local liquid density and force applied on a tip of atomic force microscope: A theoretical analysis for simple liquids

    Energy Technology Data Exchange (ETDEWEB)

    Amano, Ken-ichi, E-mail: aman@tohoku-pharm.ac.jp; Takahashi, Ohgi [Faculty of Pharmaceutical Sciences, Tohoku Pharmaceutical University, 4-4-1 Komatsushima, Aoba-ku, Sendai 981-8558 (Japan); Suzuki, Kazuhiro [Department of Electronic Science and Engineering, Kyoto University, Katsura, Nishikyo, Kyoto 615-8510 (Japan); Fukuma, Takeshi [Bio-AFM Frontier Research Center, Kanazawa University, Kakuma-machi, Kanazawa 920-1192 (Japan); Onishi, Hiroshi [Department of Chemistry, Faculty of Science, Kobe University, Nada-ku, Kobe 657-8501 (Japan)

    2013-12-14

    The density of a liquid is not uniform when placed on a solid. The structured liquid pushes or pulls a probe employed in atomic force microscopy, as demonstrated in a number of experimental studies. In the present study, the relation between the force on a probe and the local density of a liquid is derived based on the statistical mechanics of simple liquids. When the probe is identical to a solvent molecule, the strength of the force is shown to be proportional to the vertical gradient of ln(ρ{sub DS}) with the local liquid's density on a solid surface being ρ{sub DS}. The intrinsic liquid's density on a solid is numerically calculated and compared with the density reconstructed from the force on a probe that is identical or not identical to the solvent molecule.

  4. The relationship between local liquid density and force applied on a tip of atomic force microscope: A theoretical analysis for simple liquids

    International Nuclear Information System (INIS)

    The density of a liquid is not uniform when placed on a solid. The structured liquid pushes or pulls a probe employed in atomic force microscopy, as demonstrated in a number of experimental studies. In the present study, the relation between the force on a probe and the local density of a liquid is derived based on the statistical mechanics of simple liquids. When the probe is identical to a solvent molecule, the strength of the force is shown to be proportional to the vertical gradient of ln(ρDS) with the local liquid's density on a solid surface being ρDS. The intrinsic liquid's density on a solid is numerically calculated and compared with the density reconstructed from the force on a probe that is identical or not identical to the solvent molecule

  5. Power spectrum analysis with least-squares fitting: Amplitude bias and its elimination, with application to optical tweezers and atomic force microscope cantilevers

    DEFF Research Database (Denmark)

    Nørlykke, Simon F.; Flyvbjerg, Henrik

    2010-01-01

    Optical tweezers and atomic force microscope (AFM) cantilevers are often calibrated by fitting their experimental power spectra of Brownian motion. We demonstrate here that if this is done with typical weighted least-squares methods, the result is a bias of relative size between -2/n and + 1/n...... on the value of the fitted diffusion coefficient. Here, n is the number of power spectra averaged over, so typical calibrations contain 10%-20% bias. Both the sign and the size of the bias depend on the weighting scheme applied. Hence, so do length-scale calibrations based on the diffusion coefficient....... The fitted value for the characteristic frequency is not affected by this bias. For the AFM then, force measurements are not affected provided an independent length-scale calibration is available. For optical tweezers there is no such luck, since the spring constant is found as the ratio...

  6. Effect of the interaction conditions of the probe of an atomic-force microscope with the n-GaAs surface on the triboelectrization phenomenon

    Energy Technology Data Exchange (ETDEWEB)

    Baklanov, A. V., E-mail: baklanov@mail.ioffe.ru [St. Petersburg State Polytechnical University, Institute of Physics, Nanotechnology, and Telecommunications (Russian Federation); Gutkin, A. A.; Kalyuzhnyy, N. A. [Russian Academy of Sciences, Ioffe Institute (Russian Federation); Brunkov, P. N. [St. Petersburg State Polytechnical University, Institute of Physics, Nanotechnology, and Telecommunications (Russian Federation)

    2015-08-15

    Triboelectrization as a result of the scanning of an atomic-force-microscope probe over an n-GaAs surface in the contact mode is investigated. The dependences of the local potential variation on the scanning rate and the pressing force of the probe are obtained. The results are explained by point-defect formation in the surface layers of samples under the effect of deformation of these layers during probe scanning. The charge localized at these defects in the case of equilibrium changes the potential of surface, which is subject to triboelectrization. It is shown that, for qualitative explanation of the observed dependences, it is necessary to take into account both the generation and annihilation of defects in the region experiencing deformation.

  7. Atomic force microscopic view of the fine topography on the tobacco stigma surface during its response to pollination

    Institute of Scientific and Technical Information of China (English)

    WU Hui; LI Meng; SUN MengXiang

    2008-01-01

    During compatible pollination in tobacco, an extracellular matrix (ECM) is secreted from the stigma surface; however, it is unknown whether the pattern of secretion across the stigma depends on the pollen source. In fact, technical limitations have prevented clear observation of ECM secretion. Here, we report the detailed topographic changes on the stigma surface that accompanies intraspecies and interspecies pollination in tobacco using contact mode atomic force microscopy (AFM). Our results, which show the dynamics and time course of ECM secretion after pollination, indicate that a certain pattern of secretion already exists on the stigma prior to pollination. Intraspecies induced a two-step response, characterized by topograPhical changes on the stigma surface several hours after pollina-tion, which was distinct from the pattern of ECM secretion induced by interspecies pollination. This difference was confirmed by root-mean-square analysis, which assessed the roughness of the stigma surface. Our findings indicate that compatible pollination not only induces ECM secretion from the stigma, but also results in a specific distribution of the ECM. Thus, this study demonstrates the pow-erful potential of AFM in studying the pollen-stigma interaction.

  8. Method of mechanical holding of cantilever chip for tip-scan high-speed atomic force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Fukuda, Shingo [Department of Physics, College of Science and Engineering, Kanazawa University, Kakuma-machi, Kanazawa 920-1192 (Japan); Uchihashi, Takayuki; Ando, Toshio [Department of Physics, College of Science and Engineering, Kanazawa University, Kakuma-machi, Kanazawa 920-1192 (Japan); Bio-AFM Frontier Research Center, College of Science and Engineering, Kanazawa University, Kakuma-machi, Kanazawa 920-1192 (Japan); Core Research for Evolutional Science and Technology of the Japan Science and Technology Agency, 7 Goban-cho, Chiyoda-ku, Tokyo 102-0076 (Japan)

    2015-06-15

    In tip-scan atomic force microscopy (AFM) that scans a cantilever chip in the three dimensions, the chip body is held on the Z-scanner with a holder. However, this holding is not easy for high-speed (HS) AFM because the holder that should have a small mass has to be able to clamp the cantilever chip firmly without deteriorating the Z-scanner’s fast performance, and because repeated exchange of cantilever chips should not damage the Z-scanner. This is one of the reasons that tip-scan HS-AFM has not been established, despite its advantages over sample stage-scan HS-AFM. Here, we present a novel method of cantilever chip holding which meets all conditions required for tip-scan HS-AFM. The superior performance of this novel chip holding mechanism is demonstrated by imaging of the α{sub 3}β{sub 3} subcomplex of F{sub 1}-ATPase in dynamic action at ∼7 frames/s.

  9. The ReactorAFM: Non-contact atomic force microscope operating under high-pressure and high-temperature catalytic conditions

    Energy Technology Data Exchange (ETDEWEB)

    Roobol, S. B.; Cañas-Ventura, M. E.; Bergman, M.; Spronsen, M. A. van; Onderwaater, W. G.; Tuijn, P. C. van der; Koehler, R.; Frenken, J. W. M., E-mail: frenken@arcnl.nl [Huygens-Kamerlingh Onnes Laboratory, Leiden University, P.O. Box 9504, RA Leiden 2300 (Netherlands); Ofitserov, A.; Baarle, G. J. C. van [Leiden Probe Microscopy B.V., J.H. Oortweg 21, 2333 CH Leiden (Netherlands)

    2015-03-15

    An Atomic Force Microscope (AFM) has been integrated in a miniature high-pressure flow reactor for in-situ observations of heterogeneous catalytic reactions under conditions similar to those of industrial processes. The AFM can image model catalysts such as those consisting of metal nanoparticles on flat oxide supports in a gas atmosphere up to 6 bar and at a temperature up to 600 K, while the catalytic activity can be measured using mass spectrometry. The high-pressure reactor is placed inside an Ultrahigh Vacuum (UHV) system to supplement it with standard UHV sample preparation and characterization techniques. To demonstrate that this instrument successfully bridges both the pressure gap and the materials gap, images have been recorded of supported palladium nanoparticles catalyzing the oxidation of carbon monoxide under high-pressure, high-temperature conditions.

  10. Reverse electrochemical etching method for fabricating ultra-sharp platinum/iridium tips for combined scanning tunneling microscope/ atomic force microscope based on a quartz tuning fork

    OpenAIRE

    Morán-Meza, José A.; Polesel-Maris, Jérôme; Lubin, Christophe; Thoyer, François; Makky, Ali; Ouerghi, Abdelkarim; Cousty, Jacques

    2015-01-01

    International audience Sharp Pt/Ir tips have been reproducibly etched by an electrochemical process using an inverse geometry of an electrochemical cell and a dedicated electronic device which allows us to control the applied voltages waveform and the intensity of the etching current. Conductive tips with a radius smaller than 10 nm were routinely produced as shown by field emission measurements through FowlereNordheim plots. These etched tips were then fixed on a quartz tuning fork force ...

  11. Nanometer-Scale Manipulation and Ultrasonic Cutting Using an Atomic Force Microscope Controlled by a Haptic Device as a Human Interface

    Science.gov (United States)

    Iwata, Futoshi; Ohara, Kouhei; Ishizu, Yuichi; Sasaki, Akira; Aoyama, Hisayuki; Ushiki, Tatsuo

    2008-07-01

    We describe a nanometer-scale manipulation and cutting method using ultrasonic oscillation scratching. The system is based on a modified atomic force microscope (AFM) coupled with a haptic device as a human interface. By handling the haptic device, the operator can directly move the AFM probe to manipulate nanometer scale objects and cut a surface while feeling the reaction from the surface in his or her fingers. As for manipulation using the system, nanometer-scale spheres were controllably moved by feeling the sensation of the AFM probe touching the spheres. As for cutting performance, the samples were prepared on an AT-cut quartz crystal resonator (QCR) set on an AFM sample holder. The QCR oscillates at its resonance frequency (9 MHz) with an amplitude of a few nanometers. Thus it is possible to cut the sample surface smoothly by the interaction between the AFM probe and the oscillating surface, even when the samples are viscoelastics such as polymers and biological samples. The ultrasonic nano-manipulation and cutting system would be a very useful and effective tool in the fields of nanometer-scale engineering and biological sciences.

  12. Stress relaxation and creep on living cells with the atomic force microscope: a means to calculate elastic moduli and viscosities of cell components

    Energy Technology Data Exchange (ETDEWEB)

    Moreno-Flores, Susana; Toca-Herrera, Jose Luis [Biosurfaces Unit, CIC BiomaGUNE, Paseo Miramon 182, E-20009 San Sebastian-Donostia (Spain); Benitez, Rafael [Departamento Matematicas, Centro Universitario de Plasencia, Universidad de Extremadura, Avenida Virgen del Puerto 2, E-10600 Plasencia (Spain); Vivanco, Maria dM, E-mail: jltocaherrera@cicbiomagune.es, E-mail: jose.toca-herrera@boku.ac.at [Cell Biology and Stem Cells Unit, CIC BioGUNE, Parque tecnologico de Bizkaia, Ed. 801A, E-48160 Derio (Spain)

    2010-11-05

    In this work we present a unified method to study the mechanical properties of cells using the atomic force microscope. Stress relaxation and creep compliance measurements permitted us to determine, the relaxation times, the Young moduli and the viscosity of breast cancer cells (MCF-7). The results show that the mechanical behaviour of MCF-7 cells responds to a two-layered model of similar elasticity but differing viscosity. Treatment of MCF-7 cells with an actin-depolymerising agent results in an overall decrease in both cell elasticity and viscosity, however to a different extent for each layer. The layer that undergoes the smaller decrease (36-38%) is assigned to the cell membrane/cortex while the layer that experiences the larger decrease (70-80%) is attributed to the cell cytoplasm. The combination of the method presented in this work, together with the approach based on stress relaxation microscopy (Moreno-Flores et al 2010 J. Biomech. 43 349-54), constitutes a unique AFM-based experimental framework to study cell mechanics. This methodology can also be extended to study the mechanical properties of biomaterials in general.

  13. Combined Atomic Force Microscope-Based Topographical Imaging and Nanometer Scale Resolved Proximal Probe Thermal Desorption/Electrospray Ionization-Mass Spectrometry

    Energy Technology Data Exchange (ETDEWEB)

    Ovchinnikova, Olga S [ORNL; Nikiforov, Maxim [ORNL; Bradshaw, James A [ORNL; Jesse, Stephen [ORNL; Van Berkel, Gary J [ORNL

    2011-01-01

    Nanometer scale proximal probe thermal desorption/electrospray ionization mass spectrometry (TD/ESI-MS) was demonstrated for molecular surface sampling of caffeine from a thin film using a 30 nm diameter nano-thermal analysis (nano-TA) probe tip in an atomic force microscope (AFM) coupled via a vapor transfer line and ESI interface to a MS detection platform. Using a probe temperature of 350 C and a spot sampling time of 30 s, conical desorption craters 250 nm in diameter and 100 nm deep were created as shown through subsequent topographical imaging of the surface within the same system. Automated sampling of a 5 x 2 array of spots, with 2 m spacing between spots, and real time selective detection of the desorbed caffeine using tandem mass spectrometry was also demonstrated. Estimated from the crater volume (~2x106 nm3), only about 10 amol (2 fg) of caffeine was liberated from each thermal desorption crater in the thin film. These results illustrate a relatively simple experimental setup and means to acquire in automated fashion sub-micrometer scale spatial sampling resolution and mass spectral detection of materials amenable to TD. The ability to achieve MS-based chemical imaging with 250 nm scale spatial resolution with this system is anticipated.

  14. Atomic force microscopy and direct surface force measurements

    NARCIS (Netherlands)

    Ralston, J.; Larson, I.; Rutland, M.; Feiler, A.; Kleijn, J.M.

    2005-01-01

    The atomic force microscope (AFM) is designed to provide high-resolution (in the ideal case, atomic) topographical analysis, applicable to both conducting and nonconducting surfaces. The basic imaging principle is very simple: a sample attached to a piezoelectric positioner is rastered beneath a sha

  15. Correlation of embryonic skeletal muscle myotube physical characteristics with contractile force generation on an atomic force microscope-based bio-microelectromechanical systems device

    Science.gov (United States)

    Pirozzi, K. L.; Long, C. J.; McAleer, C. W.; Smith, A. S. T.; Hickman, J. J.

    2013-08-01

    Rigorous analysis of muscle function in in vitro systems is needed for both acute and chronic biomedical applications. Forces generated by skeletal myotubes on bio-microelectromechanical cantilevers were calculated using a modified version of Stoney's thin-film equation and finite element analysis (FEA), then analyzed for regression to physical parameters. The Stoney's equation results closely matched the more intensive FEA and the force correlated to cross-sectional area (CSA). Normalizing force to measured CSA significantly improved the statistical sensitivity and now allows for close comparison of in vitro data to in vivo measurements for applications in exercise physiology, robotics, and modeling neuromuscular diseases.

  16. A Quantum Gas Microscope for Fermionic Atoms

    OpenAIRE

    Cheuk, Lawrence W.; Nichols, Matthew A.; Okan, Melih; Gersdorf, Thomas; Ramasesh, Vinay V.; Bakr, Waseem S.; Lompe, Thomas; Zwierlein, Martin W.

    2015-01-01

    Strongly interacting fermions define the properties of complex matter at all densities, from atomic nuclei to modern solid state materials and neutron stars. Ultracold atomic Fermi gases have emerged as a pristine platform for the study of many-fermion systems. Here we realize a quantum gas microscope for fermionic $^{40}$K atoms trapped in an optical lattice, which allows one to probe strongly correlated fermions at the single atom level. We combine 3D Raman sideband cooling with high-resolu...

  17. Modeling of contact theories for the manipulation of biological micro/nanoparticles in the form of circular crowned rollers based on the atomic force microscope

    International Nuclear Information System (INIS)

    This article has dealt with the development and modeling of various contact theories for biological nanoparticles shaped as cylinders and circular crowned rollers for application in the manipulation of different biological micro/nanoparticles based on Atomic Force Microscope. First, the effective contact forces were simulated, and their impact on contact mechanics simulation was investigated. In the next step, the Hertz contact model was simulated and compared for gold and DNA nanoparticles with the three types of spherical, cylindrical, and circular crowned roller type contact geometries. Then by reducing the length of the cylindrical section in the circular crowned roller geometry, the geometry of the body was made to approach that of a sphere, and the results were compared for DNA nanoparticles. To anticipatory validate the developed theories, the results of the cylindrical and the circular crowned roller contacts were compared with the results of the existing spherical contact simulations. Following the development of these contact models for the manipulation of various biological micro/nanoparticles, the cylindrical and the circular crowned roller type contact theories were modeled based on the theories of Lundberg, Dowson, Nikpur, Heoprich, and Hertz for the manipulation of biological micro/nanoparticles. Then, for a more accurate validation, the results obtained from the simulations were compared with those obtained by the finite element method and with the experimental results available in previous articles. The previous research works on the simulation of nanomanipulation have mainly investigated the contact theories used in the manipulation of spherical micro/nanoparticles. However since in real biomanipulation situations, biological micro/nanoparticles of more complex shapes need to be displaced in biological environments, this article therefore has modeled and compared, for the first time, different contact theories for use in the biomanipulation of

  18. Macroscopic model of scanning force microscope

    Science.gov (United States)

    Guerra-Vela, Claudio; Zypman, Fredy R.

    2004-10-05

    A macroscopic version of the Scanning Force Microscope is described. It consists of a cantilever under the influence of external forces, which mimic the tip-sample interactions. The use of this piece of equipment is threefold. First, it serves as direct way to understand the parts and functions of the Scanning Force Microscope, and thus it is effectively used as an instructional tool. Second, due to its large size, it allows for simple measurements of applied forces and parameters that define the state of motion of the system. This information, in turn, serves to compare the interaction forces with the reconstructed ones, which cannot be done directly with the standard microscopic set up. Third, it provides a kinematics method to non-destructively measure elastic constants of materials, such as Young's and shear modules, with special application for brittle materials.

  19. Capillary forces in tapping mode atomic force microscopy

    NARCIS (Netherlands)

    Zitzler, L.; Herminghaus, S.; Mugele, F.

    2002-01-01

    We investigated the influence of the relative humidity on amplitude and phase of the cantilever oscillation while operating an atomic force microscope (AFM) in the tapping mode. If the free oscillation amplitude A0 exceeds a certain critical amplitude Ac, the amplitude- and phase-distance curves sho

  20. A quantum gas microscope for ytterbium atoms

    Science.gov (United States)

    Takahashi, Yoshiro

    2016-05-01

    In this talk, I report on the development of a quantum gas microscope for ytterbium (Yb) atoms. By using a dual molasses technique in which 399 nm molasses beams of the broad singlet transition are applied for fluorescence imaging and 556 nm molasses beams of the narrow intercombination transition are applied for cooling during the imaging, we successfully demonstrate site-resolved imaging of individual bosonic 174 Yb atoms in a two-dimensional optical lattice with a lattice constant of 266 nm.We also apply a high resolution laser spectroscopy using the ultranarrow intercombination transition between the 1 S0 and 3 P2 states to manipulate an atom distribution in an optical lattice. We expect the demonstrated technique will similarly work for other isotopes of Yb atoms. We are also developing a different mode of an Yb quantum gas microscope.

  1. Mechanism of Origin and Neutralization of Residual Triboelectricity at Scanning of Dielectric Surfaces by a Silicon Probe of the Atomic-force Microscope

    Directory of Open Access Journals (Sweden)

    М.А. Bondarenko

    2014-06-01

    Full Text Available The reasons and mechanism of the destructive effect of the electrostatic interaction forces of silicon probe and dielectric surfaces are established in the paper at the investigation of the surface microgeometry and mechanical characteristics by the atomic-force microscopy method. Calculation of the electrostatic interaction forces of two silicon surfaces is carried out and the destructive effect of electrostatic discharge appearing as a result of triboelectric effect is determined. The module of removal of electrostatic charge is proposed. Its principle of operation consists in the formation of the conduction band in the place of contact of two dielectrics by the multiphoton ionization. It is shown that application of such method of neutralization of residual triboelectricity improves accuracy, reliability, and reproducibility of the scanning results.

  2. A Scanning Quantum Cryogenic Atom Microscope

    CERN Document Server

    Yang, Fan; Taylor, Stephen F; Turner, Richard W; Lev, Benjamin L

    2016-01-01

    Microscopic imaging of local magnetic fields provides a window into the organizing principles of complex and technologically relevant condensed matter materials. However, a wide variety of intriguing strongly correlated and topologically nontrivial materials exhibit poorly understood phenomena outside the detection capability of state-of-the-art high-sensitivity, high-resolution scanning probe magnetometers. We introduce a quantum-noise-limited scanning probe magnetometer that can operate from room-to-cryogenic temperatures with unprecedented DC-field sensitivity and micron-scale resolution. The Scanning Quantum Cryogenic Atom Microscope (SQCRAMscope) employs a magnetically levitated atomic Bose-Einstein condensate (BEC), thereby providing immunity to conductive and blackbody radiative heating. The SQCRAMscope has a noise floor of 300 pT and provides a 100x improvement in magnetic flux sensitivity over previous atomic scanning probe magnetometers. These capabilities are carefully benchmarked by imaging magnet...

  3. Exploring the retention properties of CaF2 nanoparticles as possible additives for dental care application with tapping-mode atomic force microscope in liquid

    Directory of Open Access Journals (Sweden)

    Matthias Wasem

    2014-01-01

    Full Text Available Amplitude-modulation atomic force microscopy (AM-AFM is used to determine the retention properties of CaF2 nanoparticles adsorbed on mica and on tooth enamel in liquid. From the phase-lag of the forced cantilever oscillation the local energy dissipation at the detachment point of the nanoparticle was determined. This enabled us to compare different as-synthesized CaF2 nanoparticles that vary in shape, size and surface structure. CaF2 nanoparticles are candidates for additives in dental care products as they could serve as fluorine-releasing containers preventing caries during a cariogenic acid attack on the teeth. We show that the adherence of the nanoparticles is increased on the enamel substrate compared to mica, independently of the substrate roughness, morphology and size of the particles.

  4. Dynamic atomic force microscopy methods

    Science.gov (United States)

    García, Ricardo; Pérez, Rubén

    2002-09-01

    In this report we review the fundamentals, applications and future tendencies of dynamic atomic force microscopy (AFM) methods. Our focus is on understanding why the changes observed in the dynamic properties of a vibrating tip that interacts with a surface make possible to obtain molecular resolution images of membrane proteins in aqueous solutions or to resolve atomic-scale surface defects in ultra high vacuum (UHV). Our description of the two major dynamic AFM modes, amplitude modulation atomic force microscopy (AM-AFM) and frequency modulation atomic force microscopy (FM-AFM) emphasises their common points without ignoring the differences in experimental set-ups and operating conditions. Those differences are introduced by the different feedback parameters, oscillation amplitude in AM-AFM and frequency shift and excitation amplitude in FM-AFM, used to track the topography and composition of a surface. The theoretical analysis of AM-AFM (also known as tapping-mode) emphasises the coexistence, in many situations of interests, of two stable oscillation states, a low and high amplitude solution. The coexistence of those oscillation states is a consequence of the presence of attractive and repulsive components in the interaction force and their non-linear dependence on the tip-surface separation. We show that key relevant experimental properties such as the lateral resolution, image contrast and sample deformation are highly dependent on the oscillation state chosen to operate the instrument. AM-AFM allows to obtain simultaneous topographic and compositional contrast in heterogeneous samples by recording the phase angle difference between the external excitation and the tip motion (phase imaging). Significant applications of AM-AFM such as high-resolution imaging of biomolecules and polymers, large-scale patterning of silicon surfaces, manipulation of single nanoparticles or the fabrication of single electron devices are also reviewed. FM-AFM (also called non

  5. Atomic force fluorescence microscopy : combining the best of two worlds

    NARCIS (Netherlands)

    Kassies, Roelf

    2005-01-01

    The complementary strengths and weaknesses of AFM and optical microscopy leads to the desire to integrate both techniques into a single microscope. This thesis describes the development of a com-bined AFM / confocal °uorescence microscope. This atomic force °uorescence microscope (AFFM) combines hig

  6. Design and simulation of state-oscillated tapping mode atomic force microscope%状态激励轻敲模式原子力显微镜的设计与仿真

    Institute of Scientific and Technical Information of China (English)

    华宝成; 钱建强; 姚骏恩

    2011-01-01

    A novel driving method referred to as state-oscillated is designed for tapping mode atomic force microscope, which gets rid of external drive signal of state-feedback tapping mode atomic force microscope. An automatic gain controller is added to keep the statefeedback signal amplitude constant. This signal is used as the driving signal of the cantilever. Numerical simulation method is applied to study the work principle of the system using the Matlab/Simulink software. Classic simulation experiments in tapping mode atomic force microscope such as amplitude vs. distance curve and line scan curve are achieved. The results show that state-oscillated tapping mode atomic force microscope can be operated successfully.%为轻敲模式原子力显微镜设计了一种激励方式,在带有状态反馈的轻敲模式原子力显微镜基础上,除去原有的外加激励信号而引入一个自动增益控制环节,用于维持状态反馈信号的幅度恒定,并将此信号作为悬臂振动的漱励信号.读激励方式即为状态激励,用于轻跛模式时可称为状态激励轻敲模式原子力显微镜.采用Matlab/Simulink工兵实现了对状态激励轻敲模式原子力显微镜系统的建模和数值仿真,起振曲线证明了状态激励信号能够驱动悬臂振动并调整其工作频率;逼近曲线、线扫描曲线等典型功能仿真实验证明了状态激励方式能够成功地应用于轻敲模式成像.

  7. 蛋白质对 PVDF 超滤膜污染行为的界面微观作用力解析%Adhesion Force Analysis of Protein Fouling of PVDF Ultrafiltration Membrane Using Atomic Force Microscope

    Institute of Scientific and Technical Information of China (English)

    王旭东; 周淼; 孟晓荣; 王磊; 黄丹曦; 夏四清

    2015-01-01

    To determine the fouling behavior of bovine serum albumin (BSA) on different hydrophilic PVDF ultrafiltration membrane over a range of pH, atomic force microscopy (AFM) and self-made colloidal probes were used to detect the microscopic adhesion forces of membrane-BSA and BSA-BSA, respectively. The results showed a positive correlation between the flux decline extent and the membrane-foulant adhesion force in the initial filtration stage, whereas the foulant-foulant interaction force was closely related to the membrane fouling in the later filtration stage. Moreover, the membrane-BSA adhesion interaction was stronger than the BSA-BSA adhesion interaction, which indicated that the fouling was mainly caused by the adhesion interaction between membrane and foulant. At the same pH, the adhesion force between PA membrane-BSA was smaller than that of PP membrane-BSA, illustrating the more hydrophilic the membrane was, the better the antifouling ability it had. The adhesion force between BSA-BSA fouled PA membrane was similar to that between BSA-BSA fouled PP membrane. These results confirmed that elimination of the membrane-BSA adhesion force is important to control the protein fouling of membranes.%采用原子力显微镜,结合自制微颗粒探针,对膜-污染物及污染物-污染物间微观作用力进行了检测分析,考察了不同 pH条件下牛血清蛋白(BSA)在不同界面特性 PVDF 超滤膜上的膜污染行为。结果表明,在膜过滤初期,通量剧烈衰减主要由 BSA和膜之间黏附力作用导致,在膜过滤后期,BSA 与 BSA 之间的黏聚作用则是影响后期膜污染行为的主要因素; PA 膜-BSA 和PP 膜-BSA 之间的黏附作用力均大于 BSA-BSA 之间的黏聚作用力,说明在整个膜过滤过程中,BSA 与 PVDF 超滤膜之间的黏附作用对膜污染起主导作用;相同 pH 条件下,PA 膜-BSA 之间的微观作用小于 PP 膜-BSA 之间的相互作用力,说明亲水性较强的 PA 膜具

  8. The role of surface corrugation and tip oscillation in single-molecule manipulation with a non-contact atomic force microscope.

    Science.gov (United States)

    Wagner, Christian; Fournier, Norman; Tautz, F Stefan; Temirov, Ruslan

    2014-01-01

    Scanning probe microscopy (SPM) plays an important role in the investigation of molecular adsorption. The possibility to probe the molecule-surface interaction while tuning its strength through SPM tip-induced single-molecule manipulation has particularly promising potential to yield new insights. We recently reported experiments, in which 3,4,9,10-perylene-tetracarboxylic-dianhydride (PTCDA) molecules were lifted with a qPlus-sensor and analyzed these experiments by using force-field simulations. Irrespective of the good agreement between the experiment and those simulations, systematic inconsistencies remained that we attribute to effects omitted from the initial model. Here we develop a more realistic simulation of single-molecule manipulation by non-contact AFM that includes the atomic surface corrugation, the tip elasticity, and the tip oscillation amplitude. In short, we simulate a full tip oscillation cycle at each step of the manipulation process and calculate the frequency shift by solving the equation of motion of the tip. The new model correctly reproduces previously unexplained key features of the experiment, and facilitates a better understanding of the mechanics of single-molecular junctions. Our simulations reveal that the surface corrugation adds a positive frequency shift to the measurement that generates an apparent repulsive force. Furthermore, we demonstrate that the scatter observed in the experimental data points is related to the sliding of the molecule across the surface. PMID:24605287

  9. The role of surface corrugation and tip oscillation in single-molecule manipulation with a non-contact atomic force microscope

    Directory of Open Access Journals (Sweden)

    Christian Wagner

    2014-02-01

    Full Text Available Scanning probe microscopy (SPM plays an important role in the investigation of molecular adsorption. The possibility to probe the molecule–surface interaction while tuning its strength through SPM tip-induced single-molecule manipulation has particularly promising potential to yield new insights. We recently reported experiments, in which 3,4,9,10-perylene-tetracarboxylic-dianhydride (PTCDA molecules were lifted with a qPlus-sensor and analyzed these experiments by using force-field simulations. Irrespective of the good agreement between the experiment and those simulations, systematic inconsistencies remained that we attribute to effects omitted from the initial model. Here we develop a more realistic simulation of single-molecule manipulation by non-contact AFM that includes the atomic surface corrugation, the tip elasticity, and the tip oscillation amplitude. In short, we simulate a full tip oscillation cycle at each step of the manipulation process and calculate the frequency shift by solving the equation of motion of the tip. The new model correctly reproduces previously unexplained key features of the experiment, and facilitates a better understanding of the mechanics of single-molecular junctions. Our simulations reveal that the surface corrugation adds a positive frequency shift to the measurement that generates an apparent repulsive force. Furthermore, we demonstrate that the scatter observed in the experimental data points is related to the sliding of the molecule across the surface.

  10. Atomic Force Controlled Capillary Electrophoresis

    Science.gov (United States)

    Lewis, Aaron; Yeshua, Talia; Palchan, Mila; Lovsky, Yulia; Taha, Hesham

    2010-03-01

    Lithography based on scanning probe microscopic techniques has considerable potential for accurate & localized deposition of material on the nanometer scale. Controlled deposition of metallic features with high purity and spatial accuracy is of great interest for circuit edit applications in the semiconductor industry, for plasmonics & nanophotonics and for basic research in surface enhanced Raman scattering & nanobiophysics. Within the context of metal deposition we will review the development of fountain pen nanochemistry and its most recent emulation Atomic Force Controlled Capillary Electrophoresis (ACCE). Using this latter development we will demonstrate achievement of unprecedented control of nanoparticle deposition using a three-electrode geometry. Three electrodes are attached: one on the outside of a metal coated glass probe, one on the inside of a hollow probe in a solution containing Au nanoparticles in the capillary, and a third on the surface where the writing takes place. The three electrodes provide electrical pulses for accurate control of deposition and retraction of the liquid from the surface overcoming the lack of control seen in both dip pen lithography & fountain pen nanochemistry when the tip contacts the surface. With this development, we demonstrate depositing a single 1.3 nm Au nanoparticle onto surfaces such as semiconductors.

  11. Quantum Gas Microscope for Fermionic Atoms

    Science.gov (United States)

    Okan, Melih; Cheuk, Lawrence; Nichols, Matthew; Lawrence, Katherine; Zhang, Hao; Zwierlein, Martin

    2016-05-01

    Strongly interacting fermions define the properties of complex matter throughout nature, from atomic nuclei and modern solid state materials to neutron stars. Ultracold atomic Fermi gases have emerged as a pristine platform for the study of many-fermion systems. In this poster we demonstrate the realization of a quantum gas microscope for fermionic 40 K atoms trapped in an optical lattice and the recent experiments which allows one to probe strongly correlated fermions at the single atom level. We combine 3D Raman sideband cooling with high- resolution optics to simultaneously cool and image individual atoms with single lattice site resolution at a detection fidelity above 95%. The imaging process leaves the atoms predominantly in the 3D motional ground state of their respective lattice sites, inviting the implementation of a Maxwell's demon to assemble low-entropy many-body states. Single-site resolved imaging of fermions enables the direct observation of magnetic order, time resolved measurements of the spread of particle correlations, and the detection of many-fermion entanglement. NSF, AFOSR-PECASE, AFOSR-MURI on Exotic Phases of Matter, ARO-MURI on Atomtronics, ONR, a Grant from the Army Research Office with funding from the DARPA OLE program, and the David and Lucile Packard Foundation.

  12. Immunogold labels: cell-surface markers in atomic force microscopy

    NARCIS (Netherlands)

    Putman, Constant A.J.; Grooth, de Bart G.; Hansma, Paul K.; Hulst, van Niek F.; Greve, Jan

    1993-01-01

    The feasibility of using immunogold labels as cell-surface markers in atomic force microscopy is shown in this paper. The atomic force microscope (AFM) was used to image the surface of immunogold-labeled human lymphocytes. The lymphocytes were isolated from whole blood and labeled by an indirect imm

  13. Characterization of surface modification in atomic force microscope-induced nanolithography of oxygen deficient La0.67Ba0.33MnO3−δ thin films

    Directory of Open Access Journals (Sweden)

    E. Kevin Tanyi

    2014-12-01

    Full Text Available We report our studies of the nanolithographic surface modifications induced by an Atomic Force Microscope (AFM in epitaxial thin films of oxygen deficient Lanthanum Barium Manganese Oxide (La0.67Ba0.33MnO3−δ. The pattern characteristics depend on the tip voltage, tip polarity, voltage duration, tip force, and humidity. We have used Electron Energy Dispersive X-Ray Spectroscopy (EDS to analyze the chemical changes associated with the surface modifications produced with a negatively biased AFM tip. A significant increase in the oxygen stoichiometry for the patterned regions relative to the pristine film surface is observed. The results also indicate changes in the cation stoichiometry, specifically a decrease in the Lanthanum and Manganese concentrations and an increase in the Barium concentration in the patterned regions.

  14. Dielectrophoretic immobilization of proteins: Quantification by atomic force microscopy.

    Science.gov (United States)

    Laux, Eva-Maria; Knigge, Xenia; Bier, Frank F; Wenger, Christian; Hölzel, Ralph

    2015-09-01

    The combination of alternating electric fields with nanometer-sized electrodes allows the permanent immobilization of proteins by dielectrophoretic force. Here, atomic force microscopy is introduced as a quantification method, and results are compared with fluorescence microscopy. Experimental parameters, for example the applied voltage and duration of field application, are varied systematically, and the influence on the amount of immobilized proteins is investigated. A linear correlation to the duration of field application was found by atomic force microscopy, and both microscopical methods yield a square dependence of the amount of immobilized proteins on the applied voltage. While fluorescence microscopy allows real-time imaging, atomic force microscopy reveals immobilized proteins obscured in fluorescence images due to low S/N. Furthermore, the higher spatial resolution of the atomic force microscope enables the visualization of the protein distribution on single nanoelectrodes. The electric field distribution is calculated and compared to experimental results with very good agreement to atomic force microscopy measurements. PMID:26010162

  15. Observation of Switchable Photoresponse of a Monolayer WSe2-MoS2 Lateral Heterostructure via Photocurrent Spectral Atomic Force Microscopic Imaging.

    Science.gov (United States)

    Son, Youngwoo; Li, Ming-Yang; Cheng, Chia-Chin; Wei, Kung-Hwa; Liu, Pingwei; Wang, Qing Hua; Li, Lain-Jong; Strano, Michael S

    2016-06-01

    In the pursuit of two-dimensional (2D) materials beyond graphene, enormous advances have been made in exploring the exciting and useful properties of transition metal dichalcogenides (TMDCs), such as a permanent band gap in the visible range and the transition from indirect to direct band gap due to 2D quantum confinement, and their potential for a wide range of device applications. In particular, recent success in the synthesis of seamless monolayer lateral heterostructures of different TMDCs via chemical vapor deposition methods has provided an effective solution to producing an in-plane p-n junction, which is a critical component in electronic and optoelectronic device applications. However, spatial variation of the electronic and optoelectonic properties of the synthesized heterojunction crystals throughout the homogeneous as well as the lateral junction region and the charge carrier transport behavior at their nanoscale junctions with metals remain unaddressed. In this work, we use photocurrent spectral atomic force microscopy to image the current and photocurrent generated between a biased PtIr tip and a monolayer WSe2-MoS2 lateral heterostructure. Current measurements in the dark in both forward and reverse bias reveal an opposite characteristic diode behavior for WSe2 and MoS2, owing to the formation of a Schottky barrier of dissimilar properties. Notably, by changing the polarity and magnitude of the tip voltage applied, pixels that show the photoresponse of the heterostructure are observed to be selectively switched on and off, allowing for the realization of a hyper-resolution array of the switchable photodiode pixels. This experimental approach has significant implications toward the development of novel optoelectronic technologies for regioselective photodetection and imaging at nanoscale resolutions. Comparative 2D Fourier analysis of physical height and current images shows high spatial frequency variations in substrate/MoS2 (or WSe2) contact that

  16. Observation of Switchable Photoresponse of a Monolayer WSe 2 –MoS 2 Lateral Heterostructure via Photocurrent Spectral Atomic Force Microscopic Imaging

    KAUST Repository

    Son, Youngwoo

    2016-04-27

    In the pursuit of two-dimensional (2D) materials beyond graphene, enormous advances have been made in exploring the exciting and useful properties of transition metal dichalcogenides (TMDCs), such as a permanent band gap in the visible range and the transition from indirect to direct band gap due to 2D quantum confinement, and their potential for a wide range of device applications. In particular, recent success in the synthesis of seamless monolayer lateral heterostructures of different TMDCs via chemical vapor deposition methods has provided an effective solution to producing an in-plane p-n junction, which is a critical component in electronic and optoelectronic device applications. However, spatial variation of the electronic and optoelectonic properties of the synthesized heterojunction crystals throughout the homogeneous as well as the lateral junction region and the charge carrier transport behavior at their nanoscale junctions with metals remain unaddressed. In this work, we use photocurrent spectral atomic force microscopy to image the current and photocurrent generated between a biased PtIr tip and a monolayer WSe2-MoS2 lateral heterostructure. Current measurements in the dark in both forward and reverse bias reveal an opposite characteristic diode behavior for WSe2 and MoS2, owing to the formation of a Schottky barrier of dissimilar properties. Notably, by changing the polarity and magnitude of the tip voltage applied, pixels that show the photoresponse of the heterostructure are observed to be selectively switched on and off, allowing for the realization of a hyper-resolution array of the switchable photodiode pixels. This experimental approach has significant implications toward the development of novel optoelectronic technologies for regioselective photodetection and imaging at nanoscale resolutions. Comparative 2D Fourier analysis of physical height and current images shows high spatial frequency variations in substrate/MoS2 (or WSe2) contact that

  17. Combined scanning electrochemical-atomic force microscopy.

    Science.gov (United States)

    Macpherson, J V; Unwin, P R

    2000-01-15

    A combined scanning electrochemical microscope (SECM)-atomic force microscope (AFM) is described. The instrument permits the first simultaneous topographical and electrochemical measurements at surfaces, under fluid, with high spatial resolution. Simple probe tips suitable for SECM-AFM, have been fabricated by coating flattened and etched Pt microwires with insulating, electrophoretically deposited paint. The flattened portion of the probe provides a flexible cantilever (force sensor), while the coating insulates the probe such that only the tip end (electrode) is exposed to the solution. The SECM-AFM technique is illustrated with simultaneous electrochemical-probe deflection approach curves, simultaneous topographical and electrochemical imaging studies of track-etched polycarbonate ultrafiltration membranes, and etching studies of crystal surfaces. PMID:10658320

  18. Dissipation and oscillatory solvation forces in confined liquids studied by small-amplitude atomic force spectroscopy

    NARCIS (Netherlands)

    Beer, de Sissi; Ende, van den Dirk; Mugele, Frieder

    2010-01-01

    We determine conservative and dissipative tip–sample interaction forces from the amplitude and phase response of acoustically driven atomic force microscope (AFM) cantilevers using a non-polar model fluid (octamethylcyclotetrasiloxane, which displays strong molecular layering) and atomically flat su

  19. Microfluidics, Chromatography, and Atomic-Force Microscopy

    Science.gov (United States)

    Anderson, Mark

    2008-01-01

    A Raman-and-atomic-force microscope (RAFM) has been shown to be capable of performing several liquid-transfer and sensory functions essential for the operation of a microfluidic laboratory on a chip that would be used to perform rapid, sensitive chromatographic and spectro-chemical analyses of unprecedentedly small quantities of liquids. The most novel aspect of this development lies in the exploitation of capillary and shear effects at the atomic-force-microscope (AFM) tip to produce shear-driven flow of liquids along open microchannels of a microfluidic device. The RAFM can also be used to perform such functions as imaging liquids in microchannels; removing liquid samples from channels for very sensitive, tip-localized spectrochemical analyses; measuring a quantity of liquid adhering to the tip; and dip-pen deposition from a chromatographic device. A commercial Raman-spectroscopy system and a commercial AFM were integrated to make the RAFM so as to be able to perform simultaneous topographical AFM imaging and surface-enhanced Raman spectroscopy (SERS) at the AFM tip. The Raman-spectroscopy system includes a Raman microprobe attached to an optical microscope, the translation stage of which is modified to accommodate the AFM head. The Raman laser excitation beam, which is aimed at the AFM tip, has a wavelength of 785 nm and a diameter of about 5 m, and its power is adjustable up to 10 mW. The AFM is coated with gold to enable tip-localized SERS.

  20. Atomic force microscopy of biological samples.

    Science.gov (United States)

    Allison, David P; Mortensen, Ninell P; Sullivan, Claretta J; Doktycz, Mitchel J

    2010-01-01

    The ability to evaluate structural-functional relationships in real time has allowed scanning probe microscopy (SPM) to assume a prominent role in post genomic biological research. In this mini-review, we highlight the development of imaging and ancillary techniques that have allowed SPM to permeate many key areas of contemporary research. We begin by examining the invention of the scanning tunneling microscope (STM) by Binnig and Rohrer in 1982 and discuss how it served to team biologists with physicists to integrate high-resolution microscopy into biological science. We point to the problems of imaging nonconductive biological samples with the STM and relate how this led to the evolution of the atomic force microscope (AFM) developed by Binnig, Quate, and Gerber, in 1986. Commercialization in the late 1980s established SPM as a powerful research tool in the biological research community. Contact mode AFM imaging was soon complemented by the development of non-contact imaging modes. These non-contact modes eventually became the primary focus for further new applications including the development of fast scanning methods. The extreme sensitivity of the AFM cantilever was recognized and has been developed into applications for measuring forces required for indenting biological surfaces and breaking bonds between biomolecules. Further functional augmentation to the cantilever tip allowed development of new and emerging techniques including scanning ion-conductance microscopy (SICM), scanning electrochemical microscope (SECM), Kelvin force microscopy (KFM) and scanning near field ultrasonic holography (SNFUH). PMID:20672388

  1. Atomic force microscopy of biological samples

    Energy Technology Data Exchange (ETDEWEB)

    Doktycz, Mitchel John [ORNL

    2010-01-01

    The ability to evaluate structural-functional relationships in real time has allowed scanning probe microscopy (SPM) to assume a prominent role in post genomic biological research. In this mini-review, we highlight the development of imaging and ancillary techniques that have allowed SPM to permeate many key areas of contemporary research. We begin by examining the invention of the scanning tunneling microscope (STM) by Binnig and Rohrer in 1982 and discuss how it served to team biologists with physicists to integrate high-resolution microscopy into biological science. We point to the problems of imaging nonconductive biological samples with the STM and relate how this led to the evolution of the atomic force microscope (AFM) developed by Binnig, Quate, and Gerber, in 1986. Commercialization in the late 1980s established SPM as a powerful research tool in the biological research community. Contact mode AFM imaging was soon complemented by the development of non-contact imaging modes. These non-contact modes eventually became the primary focus for further new applications including the development of fast scanning methods. The extreme sensitivity of the AFM cantilever was recognized and has been developed into applications for measuring forces required for indenting biological surfaces and breaking bonds between biomolecules. Further functional augmentation to the cantilever tip allowed development of new and emerging techniques including scanning ion-conductance microscopy (SICM), scanning electrochemical microscope (SECM), Kelvin force microscopy (KFM) and scanning near field ultrasonic holography (SNFUH).

  2. Immunogold labels: cell-surface markers in atomic force microscopy

    OpenAIRE

    Putman, Constant A.J.; Grooth, de, B.G.; Hansma, Paul K.; Hulst, van der, R.W.M.; Greve, Jan

    1993-01-01

    The feasibility of using immunogold labels as cell-surface markers in atomic force microscopy is shown in this paper. The atomic force microscope (AFM) was used to image the surface of immunogold-labeled human lymphocytes. The lymphocytes were isolated from whole blood and labeled by an indirect immunolabeling method using the monoclonal antibody anti-CD3 and a secondary antibody (Goat-anti-Mouse) linked to 30 nm colloidal gold particles. Some of the samples were enhanced by silver deposition...

  3. Calibration of lateral force measurements in atomic force microscopy with a piezoresistive force sensor

    International Nuclear Information System (INIS)

    We present here a method to calibrate the lateral force in the atomic force microscope. This method makes use of an accurately calibrated force sensor composed of a tipless piezoresistive cantilever and corresponding signal amplifying and processing electronics. Two ways of force loading with different loading points were compared by scanning the top and side edges of the piezoresistive cantilever. Conversion factors between the lateral force and photodiode signal using three types of atomic force microscope cantilevers with rectangular geometries (normal spring constants from 0.092 to 1.24 N/m and lateral stiffness from 10.34 to 101.06 N/m) were measured in experiments using the proposed method. When used properly, this method calibrates the conversion factors that are accurate to ±12.4% or better. This standard has less error than the commonly used method based on the cantilever's beam mechanics. Methods such of this allow accurate and direct conversion between lateral forces and photodiode signals without any knowledge of the cantilevers and the laser measuring system

  4. Theory of Atomic-Force Microscopy(STM Theory)

    OpenAIRE

    Sasaki, Naruo; Tsukada, Masaru

    1997-01-01

    The mechanism of force detection of Atomic-Force Microscopy (AFM) is theoretically investigated. First, a theoretical simulation of contact AFM images is performed, and a tip apex structure is studied. It is clarified how the AFM images and the force distributions change as the load varies. It is also revealed that the characteristics of the AFM images such as their detailed microscopic pattern, the symmetry, and the corrugation amplitude, depend strongly on the tip apex structure. Secondly, ...

  5. Study of surface forces dependence on pH by atomic force microscopy.

    Science.gov (United States)

    Gavoille, J; Takadoum, J

    2002-06-01

    We used an atomic force microscope to investigate silicon nitride tip interactions with various materials (copper, nickel, silicon carbide) as a function of pH. The electrolyte used was 10(-3) M NaCl and the interactions observed through force versus distance curves (attraction or repulsion) depended on the pH value. Interaction forces calculation was derived from force versus distance curve data and the results are discussed in terms of electrostatic interactions using Zeta potential theory. PMID:16290640

  6. Diagnosis of cervical cancer cell taken from scanning electron and atomic force microscope images of the same patients using discrete wavelet entropy energy and Jensen Shannon, Hellinger, Triangle Measure classifier

    Science.gov (United States)

    Aytac Korkmaz, Sevcan

    2016-05-01

    The aim of this article is to provide early detection of cervical cancer by using both Atomic Force Microscope (AFM) and Scanning Electron Microscope (SEM) images of same patient. When the studies in the literature are examined, it is seen that the AFM and SEM images of the same patient are not used together for early diagnosis of cervical cancer. AFM and SEM images can be limited when using only one of them for the early detection of cervical cancer. Therefore, multi-modality solutions which give more accuracy results than single solutions have been realized in this paper. Optimum feature space has been obtained by Discrete Wavelet Entropy Energy (DWEE) applying to the 3 × 180 AFM and SEM images. Then, optimum features of these images are classified with Jensen Shannon, Hellinger, and Triangle Measure (JHT) Classifier for early diagnosis of cervical cancer. However, between classifiers which are Jensen Shannon, Hellinger, and triangle distance have been validated the measures via relationships. Afterwards, accuracy diagnosis of normal, benign, and malign cervical cancer cell was found by combining mean success rates of Jensen Shannon, Hellinger, and Triangle Measure which are connected with each other. Averages of accuracy diagnosis for AFM and SEM images by averaging the results obtained from these 3 classifiers are found as 98.29% and 97.10%, respectively. It has been observed that AFM images for early diagnosis of cervical cancer have higher performance than SEM images. Also in this article, surface roughness of malign AFM images in the result of the analysis made for the AFM images, according to the normal and benign AFM images is observed as larger, If the volume of particles has found as smaller. She has been a Faculty Member at Fırat University in the Electrical- Electronic Engineering Department since 2007. Her research interests include image processing, computer vision systems, pattern recognition, data fusion, wavelet theory, artificial neural

  7. Mapping Electrostatic Forces Using Higher Harmonics Tapping Mode Atomic Force Microscopy in Liquid

    NARCIS (Netherlands)

    Noort, van S. John T.; Willemsen, Oscar H.; Werf, van der Kees O.; Grooth, de Bart G.; Greve, Jan

    1999-01-01

    A simple model of a damped, harmonic oscillator is used to describe the motion of an atomic force microscope cantilever tapping in fluid. By use of experimentally obtained parameters, excellent agreement is found between theory and experimental results. From the model we estimate that the force appl

  8. Physical microscopic model of proteins under force.

    Science.gov (United States)

    Dokholyan, Nikolay V

    2012-06-14

    Nature has evolved proteins to counteract forces applied on living cells, and has designed proteins that can sense forces. One can appreciate Nature's ingenuity in evolving these proteins to be highly sensitive to force and to have a high dynamic force range at which they operate. To achieve this level of sensitivity, many of these proteins are composed of multiple domains and linking peptides connecting these domains, each of them having their own force response regimes. Here, using a simple model of a protein, we address the question of how each individual domain responds to force. We also ask how multidomain proteins respond to forces. We find that the end-to-end distance of individual domains under force scales linearly with force. In multidomain proteins, we find that the force response has a rich range: at low force, extension is predominantly governed by "weaker" linking peptides or domain intermediates, while at higher force, the extension is governed by unfolding of individual domains. Overall, the force extension curve comprises multiple sigmoidal transitions governed by unfolding of linking peptides and domains. Our study provides a basic framework for the understanding of protein response to force, and allows for interpretation experiments in which force is used to study the mechanical properties of multidomain proteins. PMID:22375559

  9. Noncontact atomic force microscopy v.3

    CERN Document Server

    Morita, Seizo; Meyer, Ernst

    2015-01-01

    This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combine

  10. Scanning force microscope for in situ nanofocused X-ray diffraction studies

    Energy Technology Data Exchange (ETDEWEB)

    Ren, Zhe, E-mail: zhe.ren@im2np.fr; Mastropietro, Francesca; Davydok, Anton [Aix-Marseille Université, CNRS, Faculté des Sciences, Campus de Saint-Jérôme, Avenue Escadrille Normandie Niemen – Case 142, F-13397 Marseille (France); Langlais, Simon [Grenoble Institute of Technology and CNRS, BP 75, F-38402 Saint-Martin d’Hères Cedex (France); Richard, Marie-Ingrid [Aix-Marseille Université, CNRS, Faculté des Sciences, Campus de Saint-Jérôme, Avenue Escadrille Normandie Niemen – Case 142, F-13397 Marseille (France); European Synchrotron Radiation Facility (ESRF), 6 rue Jules Horowitz, BP 220, 38043 Grenoble (France); Furter, Jean-Jacques; Thomas, Olivier [Aix-Marseille Université, CNRS, Faculté des Sciences, Campus de Saint-Jérôme, Avenue Escadrille Normandie Niemen – Case 142, F-13397 Marseille (France); Dupraz, Maxime; Verdier, Marc; Beutier, Guillaume [Grenoble Institute of Technology and CNRS, BP 75, F-38402 Saint-Martin d’Hères Cedex (France); Boesecke, Peter [European Synchrotron Radiation Facility (ESRF), 6 rue Jules Horowitz, BP 220, 38043 Grenoble (France); Cornelius, Thomas W. [Aix-Marseille Université, CNRS, Faculté des Sciences, Campus de Saint-Jérôme, Avenue Escadrille Normandie Niemen – Case 142, F-13397 Marseille (France)

    2014-08-06

    An atomic force microscope has been developed for combination with sub-micrometer focused X-ray diffraction at synchrotron beamlines and in situ mechanical tests on single nanostructures. A compact scanning force microscope has been developed for in situ combination with nanofocused X-ray diffraction techniques at third-generation synchrotron beamlines. Its capabilities are demonstrated on Au nano-islands grown on a sapphire substrate. The new in situ device allows for in situ imaging the sample topography and the crystallinity by recording simultaneously an atomic force microscope (AFM) image and a scanning X-ray diffraction map of the same area. Moreover, a selected Au island can be mechanically deformed using the AFM tip while monitoring the deformation of the atomic lattice by nanofocused X-ray diffraction. This in situ approach gives access to the mechanical behavior of nanomaterials.

  11. Atomic Force Microscope 1: Veeco Dimension 3100

    Data.gov (United States)

    Federal Laboratory Consortium — Description: CORAL Name: AFM 1 A tool used to characterize the material surface, nanostructures generated by nanofabrication, nanomanipulation, and nanolithography....

  12. Food toxin detection with atomic force microscope

    Science.gov (United States)

    Externally introduced toxins or internal spoilage correlated pathogens and their metabolites are all potential sources of food toxins. To prevent and protect unsafe food, many food toxin detection techniques have been developed to detect various toxins for quality control. Although several routine m...

  13. Emissivity measurements with an Atomic Force Microscope

    OpenAIRE

    van Zwol, Pieter Jan; Ranno, Laurent; Chevrier, Joel

    2011-01-01

    We show that functionalized micromechanical bilayer levers can be used as sensitive probes to accurately measure radiative heat flux in vacuum between two materials at the micro scale. By means of calibration to one material these measurements can be made quantitative for radiative heat flux or for either temperature or material emissivity. We discuss issues and opportunities for our method and provide ample technical details regarding its implementation and demonstrate good correspondence wi...

  14. Physical Microscopic Model of Proteins Under Force

    OpenAIRE

    Dokholyan, Nikolay V.

    2012-01-01

    Nature has evolved proteins to counter-act forces applied on living cells, and designed proteins that can sense forces. One can appreciate Nature’s ingenuity in evolving these proteins to be highly sensitive to force and to have a high dynamic force range at which they operate. To achieve this level of sensitivity, many of these proteins are comprised of multiple domains and linking peptides connecting these domain, each of them have their own force response regimes. Here, using a simple mode...

  15. The magnetic resonance force microscope: A new microscopic probe of magnetic materials

    Energy Technology Data Exchange (ETDEWEB)

    Hammel, P.C.; Zhang, Z. [Los Alamos National Lab., NM (United States); Midzor, M.; Roukes, M.L. [California Inst. of Tech., Pasadena, CA (United States); Wigen, P.E. [Ohio State Univ., Columbus, OH (United States); Childress, J.R. [Univ. of Florida, Gainesville, FL (United States)

    1997-08-06

    The magnetic resonance force microscope (MRFM) marries the techniques of magnetic resonance imaging (MRI) and atomic force microscopy (AFM), to produce a three-dimensional imaging instrument with high, potentially atomic-scale, resolution. The principle of the MRFM has been successfully demonstrated in numerous experiments. By virtue of its unique capabilities the MRFM shows promise to make important contributions in fields ranging from three-dimensional materials characterization to bio-molecular structure determination. Here the authors focus on its application to the characterization and study of layered magnetic materials; the ability to illuminate the properties of buried interfaces in such materials is a particularly important goal. While sensitivity and spatial resolution are currently still far from their theoretical limits, they are nonetheless comparable to or superior to that achievable in conventional MRI. Further improvement of the MRFM will involve operation at lower temperature, application of larger field gradients, introduction of advanced mechanical resonators and improved reduction of the spurious coupling when the magnet is on the resonator.

  16. Atomic Force Analysis of Elastic Deformations of CD

    Directory of Open Access Journals (Sweden)

    A. Kuzmenko

    2013-12-01

    Full Text Available The procedure for the determination of elastic parameters according to reference nanometer lithographic marks by atomic force microscopy on samples with up to microscopic sizes is proposed. Analysis of dynamic changes of elastic characteristics that makes it possible to establish the critical rotation velocity of a CD without plastic deformations has been made.

  17. Contrast artifacts in tapping tip atomic force microscopy

    DEFF Research Database (Denmark)

    Kyhle, Anders; Sørensen, Alexis Hammer; Zandbergen, Julie Bjerring;

    1998-01-01

    When recording images with an atomic force microscope using the resonant vibrating cantilever mode, surprising strange results are often achieved. Typical artifacts are strange contours, unexpected height shifts, and sudden changes of the apparent resolution in the acquired images. Such artifacts...

  18. Design of cantilever probes for Atomic Force Microscopy (AFM)

    DEFF Research Database (Denmark)

    Pedersen, Niels Leergaard

    2000-01-01

    A cantilever beam used in an Atomic Force Microscope is optimized with respect to two different objectives. The first goal is to maximize the first eigenfrequency while keeping the stiffness of the probe constant. The second goal is to maximize the tip angle of the first eigenmode while again...

  19. Cantilever based optical interfacial force microscope

    Science.gov (United States)

    Bonander, Jeremy R.; Kim, Byung I.

    2008-03-01

    We developed a cantilever based optical interfacial force microscopy (COIFM) that employs a microactuated silicon cantilever and optical detection method to establish the measurement of the single molecular interactions using the force feedback technique. Through the direct measurement of the COIFM force-distance curves, we have demonstrated that the COIFM is capable of unveiling structural and mechanical information on interfacial water at the single molecular level over all distances between two hydrophilic surfaces.

  20. A comparative evaluation of the effect of 5.25% sodium hypochlorite and 2% chlorhexidine on the surface texture of Gutta-percha and resilon cones using atomic force microscope

    Directory of Open Access Journals (Sweden)

    Mahima Tilakchand

    2014-01-01

    Full Text Available Aims & Objectives: The purpose of this study was to investigate the effects of 5.25% sodium hypochlorite (NaOCl and 2% chlorhexidine (CHX on Gutta-percha and Resilon cones using an atomic force microscope (AFM. Materials and Methods: Gutta-percha cones (n = 15 and Resilon cones (n = 15 were cut 3 mm from their tip, attached to a glass slide with cyanoacrylate glue and immersed in 5.25% NaOCl and CHX for 1, 5, 10, 20 and 30 min. Five each of Gutta-percha and Resilon cones not treated with any disinfectant were used as control. The analysis of the surface topography was performed on the region between 1 and 2 mm from the tip using the AFM. The root mean square (RMS parameters for contact mode imaging were measured. The differences between RMS values were tested by SPSS-16.0 version statistical software [IBM SPSS (Statistical Product and Service Solutions Data Software, Chicago, US] using Kruskal-Wallis ANOVA, Mann-Whitney U-test and Wilcoxon matched pairs test. Results: There was no deterioration in the surfac e topography of Gutta-percha and Resilon when treated with 2% CHX in comparison to baseline (P < 0.05. Resilon exhibited no deterioration in topography when immersed in 5.25% NaOCl. There was a significant decrease in the mean RMS values of Gutta-percha treated with NaOCl from the control at time intervals of 1, 5, 10, 20 and 30 min.

  1. Casimir-Polder forces on moving atoms

    CERN Document Server

    Scheel, Stefan

    2009-01-01

    Polarisable atoms and molecules experience the Casimir-Polder force near magnetoelectric bodies, a force that is induced by quantum fluctuations of the electromagnetic field and the matter. Atoms and molecules in relative motion to a magnetoelectric surface experience an additional, velocity-dependent force. We present a full quantum-mechanical treatment of this force and identify a generalised Doppler effect, the time delay between photon emission and reabsorption, and the Roentgen interaction as its three sources. For ground-state atoms, the force is very small and always decelerating, hence commonly known as quantum friction. For atom and molecules in electronically excited states, on the contrary, both decelerating and accelerating forces can occur depending on the magnitude of the atomic transition frequency relative to the surface plasmon frequency.

  2. Introduction to light forces, atom cooling, and atom trapping

    OpenAIRE

    Savage, Craig,

    1995-01-01

    This paper introduces and reviews light forces, atom cooling and atom trapping. The emphasis is on the physics of the basic processes. In discussing conservative forces the semi-classical dressed states are used rather than the usual quantized field dressed states.

  3. Long range intermolecular forces in triatomic systems: connecting the atom-diatom and atom-atom-atom representations

    OpenAIRE

    Cvitas, Marko T.; Soldan, Pavel; Hutson, Jeremy M.

    2005-01-01

    The long-range forces that act between three atoms are analysed in both atom-diatom and atom-atom-atom representations. Expressions for atom-diatom dispersion coefficients are obtained in terms of 3-body nonadditive coefficients. The anisotropy of atom-diatom C_6 dispersion coefficients arises primarily from nonadditive triple-dipole and quadruple-dipole forces, while pairwise-additive forces and nonadditive triple-dipole and dipole-dipole-quadrupole forces contribute significantly to atom-di...

  4. Atomic and molecular manipulation with the scanning tunneling microscope.

    Science.gov (United States)

    Stroscio, J A; Eigler, D M

    1991-11-29

    The prospect of manipulating matter on the atomic scale has fascinated scientists for decades. This fascination may be motivated by scientific and technological opportunities, or from a curiosity about the consequences of being able to place atoms in a particular location. Advances in scanning tunneling microscopy have made this prospect a reality; single atoms can be placed at selected positions and structures can be built to a particular design atom-by-atom. Atoms and molecules may be manipulated in a variety of ways by using the interactions present in the tunnel junction of a scanning tunneling microscope. Some of these recent developments and some of the possible uses of atomic and molecular manipulation as a tool for science are discussed.

  5. Force modulation for improved conductive-mode atomic force microscopy

    NARCIS (Netherlands)

    Koelmans, Wabe W.; Sebastian, Abu; Despont, Michel; Pozidis, Haris

    2010-01-01

    We present an improved conductive-mode atomic force microscopy (C-AFM) method by modulating the applied loading force on the tip. Unreliable electrical contact and tip wear are the primary challenges for electrical characterization at the nanometer scale. The experiments show that force modulation r

  6. Envejecimiento de Almidones Termoplásticos Agrios de Yuca y Nativos de Papa por Microscopía de Fuerza Atómica Ageing of Sour Cassava and Native Potato Thermoplastic Starches by Atomic Force Microscopy

    Directory of Open Access Journals (Sweden)

    Harold A Acosta

    2006-01-01

    Full Text Available En este trabajo, se determinó la topografía de almidones termoplásticos (TPS agrio de yuca y nativo de papa, mediante microscopía de fuerza atómica (AFM, durante un periodo de 120 días de almacenamiento. Mezclas de almidones agrios (fermentados de yuca y nativo de papa, y glicerina, se procesaron en un extrusor de husillo sencillo. Láminas de TPS agrio de yuca (SCTPS y nativo de papa (NPTPS, se observaron y midieron por AFM (en modo contacto. Sus superficies mostraron incremento en rugosidad y partes lisas solo a altos contenidos de plastificante, pero SCTPS siempre tuvo menor rugosidad que NPTPS, debido a la fermentación natural del almidón agrio. Estos cambios se relacionaron con el tamaño, la forma del gránulo y particularmente con el contenido de plastificante. Los NPTPS de mayor rugosidad presentaron separación de fases a los 120 días, dada la retrogradación de las moléculas del almidón, que tienden a formar cristalitos. Estos resultados indican que el almidón agrio de yuca puede retardar la retrogradación de almidones termoplásticos, lo cual es importante durante el desarrollo de nuevos empaques biodegradables.This study reports on the topography of thermoplastic starches (TPS from sour cassava and native potato using atomic force microscopy (AFM, over a 120 day-storage period. Mixtures of sour cassava (fermented and native potato starches plus glycerine, were processed using a single-screw extruder. Sour cassava thermoplastic starch (SCTPS and native potato thermoplastic starch (NPTPS films were observed and measured by AFM (in contact mode. Their surfaces showed increased rugosity, and smooth parts only at high plasticizer content. However, SCTPS always had lower rugosity than NPTPS, due to the natural fermentation of sour cassava starch. These changes were related to starch granule size and shape, and particularly to plasticizer content. NPTPS with higher rugosity presented phase separation at 120 days, due to

  7. 白术多糖WAM-1结构的色谱分析和原子力显微镜观察%Chromatographic Analysis and Atomic Force Microscope Observation of Polysaccharide Extracted from Atractylodes macrocephala Koidz.

    Institute of Scientific and Technical Information of China (English)

    伍乐芹; 姜绍芬; 张静

    2012-01-01

    Polysaccharides extracted from the stem of Atractylodes macrocephala Koidz by hot water,were fractionated by DEAE-52 cellulose chromatography,and purified by Sephadex G-200 gel filtration chromatography to obtain a fraction, named WAM-1. HPLC and GC analysis showed that WAM-1 was a homogeneous and consisted of glucose and galactose in the molar ratio of 3. 01: 1. The molecular morphology of WAM-1 was observed under an atomic force microscope (AFM).The results showed that WAM-1 existed in different forms with different concentrations. The concentration of polysaccharide had effects on the conformation and form of chain interactions, which might be related to the interaction of intramolecular and intermolecular hydrogen bonds. At 10 μg/mL,the morphology of WAM-1 was observed clearly in rigid chains with many branches.%通过热水浸提法从草本植物白术根茎提取的水溶性粗多糖,经DEAE-52纤维素柱层析分离和Sephadex G-200凝胶过滤柱层析纯化,得到组分WAM-1.采用高效液相色谱(HPLC)检测WAM-1的纯度,气相色谱(GC)对其单糖组分进行分析,原子力显微镜(AFM)对其分子外貌进行观测.结果显示:WAM-1为均一多糖,由葡萄糖和半乳糖以3.01:1摩尔比构成;在不同浓度溶液条件下,WAM-1分子以不同形态存在,多糖溶液的浓度对WAM-1的分子链构象及链间相互作用形式产生影响,推测可能与WAM-1分子内、分子间的氢键缔合作用有关.多糖浓度为10μg/mL时,可清晰的观察到WAM-1是以刚性链状形态存在,且具有多分支结构.

  8. Biomolecular Interactions Measured by Atomic Force Microscopy

    NARCIS (Netherlands)

    Willemsen, Oscar H.; Snel, Margot M.E.; Cambi, Alessandra; Greve, Jan; Grooth, de Bart G.; Figdor, Carl G.

    2000-01-01

    Atomic force microscopy (AFM) is nowadays frequently applied to determine interaction forces between biological molecules. Starting with the detection of the first discrete unbinding forces between ligands and receptors by AFM only several years ago, measurements have become more and more quantitati

  9. Fountain pen nanochemistry: Atomic force control of chrome etching

    Science.gov (United States)

    Lewis, Aaron; Kheifetz, Yuri; Shambrodt, Efim; Radko, Anna; Khatchatryan, Edward; Sukenik, Chaim

    1999-10-01

    In this report we demonstrate a general method for affecting chemical reactions with a high degree of spatial control that has potentially wide applicability in science and technology. Our technique is based on complexing the delivery of liquid or gaseous materials through a cantilevered micropipette with an atomic force microscope that is totally integrated into a conventional optical microscope. Controlled etching of chrome is demonstrated without detectable effects on the underlying glass substrate. This simple combination allows for the nanometric spatial control of the whole world of chemical reactions in defined regions of surfaces. Applications of the technique in critical areas such as mask repair are likely.

  10. ATOMIC FORCE MICROSCOPY STUDIES OF POLYCAPROLACTONE RINGED SPHERULITES

    Institute of Scientific and Technical Information of China (English)

    Jian-bin Zhang; De-zhu Ma; Hua Zhong; Xiao-lie Luo

    2000-01-01

    The surface morphology of free-surface PCL ringed spherulites was investigated by using atomic force microscopy. The spherulites were obtained by crystallization of PCL/PVC blends of different compositions. It was found that the ringed spherulite exhibited regularly fluctuating rings on its surface. Compared with the bright-dark ring pattern of the spherulite under a polarizing microscope, it was proved that the optical characteristics of the ringed spherulite under polarizing microscope coincided with its surface characteristics. The bright rings in polarizing micrographs of the spherulite coincided with the convex rings on its surface, while the dark rings coincided with the concave rings.

  11. Atomic force microscopy investigations of peptide self-assembly

    OpenAIRE

    Sedman, Victoria L.

    2006-01-01

    The ability of short peptide fragments to self-assemble in isolation as amyloid and amyloid-like structures has prompted their use as model systems for the study of amyloid formation and recently also for their utilisation as novel nanofibrillar material. The atomic force microscope (AFM) is used here to investigate the self-assembly of two peptide systems and the development of strategies to directly manipulate and control the structures they form. The studies presented in Chapter 2 addr...

  12. Nonlinear Dynamics of Tapping Mode Atomic Force Microscopy

    OpenAIRE

    Bahrami, Arash

    2012-01-01

    A mathematical model is developed to investigate the grazing dynamics of tapping mode atomic force microscopes (AFM) subjected to a base harmonic excitation. The nonlinear dynamics of the AFM microcantilever are studied in both of the monostable and bistable phases with the microcantilever tip being, respectively, located in the monostable and bistable regions of the static bifurcation diagram in the reference configuration. Free-vibration responses of the AFM probes, including the microcanti...

  13. Atom inlays performed at room temperature using atomic force microscopy

    Science.gov (United States)

    Sugimoto, Yoshiaki; Abe, Masayuki; Hirayama, Shinji; Oyabu, Noriaki; Custance, Óscar; Morita, Seizo

    2005-02-01

    The ability to manipulate single atoms and molecules laterally for creating artificial structures on surfaces is driving us closer to the ultimate limit of two-dimensional nanoengineering. However, experiments involving this level of manipulation have been performed only at cryogenic temperatures. Scanning tunnelling microscopy has proved, so far, to be a unique tool with all the necessary capabilities for laterally pushing, pulling or sliding single atoms and molecules, and arranging them on a surface at will. Here we demonstrate, for the first time, that it is possible to perform well-controlled lateral manipulations of single atoms using near-contact atomic force microscopy even at room temperature. We report the creation of 'atom inlays', that is, artificial atomic patterns formed from a few embedded atoms in the plane of a surface. At room temperature, such atomic structures remain stable on the surface for relatively long periods of time.

  14. Electrostatic interaction in atomic force microscopy

    OpenAIRE

    Butt, Hans-Jüurgen

    1991-01-01

    In atomic force microscopy, the stylus experiences an electrostatic force when imaging in aqueous medium above a charged surface. This force has been calculated numerically with continuum theory for a silicon nitrite or silicon oxide stylus. For comparison, the Van der Waals force was also calculated. In contrast to the Van der Waals attraction, the electrostatic force is repulsive. At a distance of 0.5 nm the electrostatic force is typically 10-12-10-10 N and thus comparable in strength to t...

  15. A new concept in magnetic force microscope cantilevers

    NARCIS (Netherlands)

    Bos, van den A.G.; Dijk, van A.C.J.; Heskamp, I.R.; Abelmann, L.; Lodder, J.C.; Hadjipanayis, G.C.

    2001-01-01

    In this paper, a new design of dedicated magnetic force microscope (MFM) cantilever is presented. In this design, the cantilever and the magnetic tip are realized in an integrated manufacturing process. The use of silicon micromachining techniques enables batch fabrication of several hundred cantile

  16. Analysis of Immunolabeled Cells by Atomic Force Microscopy, Optical Microscopy, and Flow Cytometry

    OpenAIRE

    Neagu, C.; Werf, van der, W.; Putman, C.A.J.; Kraan, Y.M.; Grooth, de, B.G.; Hulst, van der, R.W.M.; Greve, J de

    1994-01-01

    In this study we investigated the applicability of the (silver- enhanced) immunogold labeling method for atomic force microscopy. Human lymphocytes were labeled with anti-CD3 conjugated to fluorescein isothiocyanate and a secondary antibody (goat anti-mouse) linked with 1- or 30-nm colloidal gold particles. Silver enhancement was applied o­n these labeled cells to increase the size of the labels. In a setup combining an inverted optical microscope and a stand-alone atomic force microscope, a ...

  17. Atomic force microscopy in cell biology

    Institute of Scientific and Technical Information of China (English)

    LU Zhexue; ZHANG Zhiling; PANG Daiwen

    2005-01-01

    The history, characteristic, operation modes and coupling techniques of atomic force microscopy (AFM) are introduced. Then the application in cell biology is reviewed in four aspects: cell immobilization methods, cell imaging, force spectrum study and cell manipulation. And the prospect of AFM application in cell biology is discussed.

  18. Optimization of adhesion mode atomic force microscopy resolves individual molecules in topography and adhesion

    NARCIS (Netherlands)

    Willemsen, O.H.; Snel, M.M.E.; Noort, van S.J.T.; Werf, van der K.O.; Grooth, de B.G.; Figdor, C.G.; Greve, J.

    1999-01-01

    The force sensor of an atomic force microscope (AFM) is sensitive enough to measure single molecular binding strengths by means of a force–distance curve. In order to combine high-force sensitivity with the spatial resolution of an AFM in topography mode, adhesion mode has been developed. Since this

  19. Microscopic derivation of electromagnetic force density in magnetic dielectric media

    Energy Technology Data Exchange (ETDEWEB)

    Shevchenko, A [Department of Applied Physics, Aalto University, PO Box 13500, FI-00076 AALTO (Finland); Hoenders, B J, E-mail: andriy.shevchenko@tkk.f [Centre for Theoretical Physics, Zernike Institute for Advanced Materials, University of Groningen, Nijenborgh 4, NL-9747 AG Groningen (Netherlands)

    2010-05-15

    Macroscopic force density imposed on a linear isotropic magnetic dielectric medium by an arbitrary electromagnetic field is derived by spatially averaging the microscopic Lorentz force density. The obtained expression differs from the commonly used expressions, but the energy-momentum tensor derived from it corresponds to a so-called Helmholtz tensor written for a medium that obeys the Clausius-Mossotti law. Thus, our microscopic derivation unambiguously proves the correctness of the Helmholtz tensor for such media. Also, the expression for the momentum density of the field obtained in our theory is different from the expressions obtained by Minkowski, Abraham, Einstein and Laub, and others. We apply the theory to particular examples of static electric, magnetic and stationary electromagnetic phenomena, and show its agreement with experimental observations. We emphasize that in contrast to a widespread belief the Abraham-Minkowski controversy cannot be resolved experimentally because of incompleteness of the theories introduced by Abraham and Minkowski.

  20. Glue-free tuning fork shear-force microscope

    Science.gov (United States)

    Mühlschlegel, P.; Toquant, J.; Pohl, D. W.; Hecht, B.

    2006-01-01

    A scanning near-field optical microscope without any glued parts is described. Key elements are the optical fiber probe/tuning fork junction and the piezotube scanner assembly. In both cases, fixation is achieved by means of controlled pressure and elastic deformation. The avoidance of glued connections was found to improve the Q factor of the shear-force sensor as well as to facilitate the replacement of the fiber probe and other parts of the scanner head. We present approach curves and shear-force images that demonstrate the performance and stability of the system.

  1. Interfacial forces between silica surfaces measured by atomic force microscopy

    Institute of Scientific and Technical Information of China (English)

    DUAN Jinming

    2009-01-01

    Colloidal particle stability and some other interfacial phenomena are governed by interfacial force interactions. The two well known forces are van der Waals force and electrostatic force, as documented by the classical Derjaguin, Landau, Verwey and Overbeek (DLVO) theory. Moreover, advances in modern instrumentation and colloid science suggested that some short-ranged forces or structure forces are important for relevant colloidal systems. The interfacial and/or molecular forces can be measured as a resultant force as function of separation distance by atomic force microscopy (AFM) colloid probe. This article presents a discussion on AFM colloid probe measurement of silica particle and silica wafer surfaces in solutions with some technical notifications in measurement and data convolution mechanisms. The measured forces are then analyzed and discussed based on the 'constant charge' and 'constant potential' models of DLVO theory. The difference between the prediction of DLVO theory and the measured results indicates that there is a strong short-range structure force between the two hydrophilic surfaces, even at extremely low ionic concentration, such as Milli-Q water purity solution.

  2. Bifurcation, chaos, and scan instability in dynamic atomic force microscopy

    Science.gov (United States)

    Cantrell, John H.; Cantrell, Sean A.

    2016-03-01

    The dynamical motion at any point on the cantilever of an atomic force microscope can be expressed quite generally as a superposition of simple harmonic oscillators corresponding to the vibrational modes allowed by the cantilever shape. Central to the dynamical equations is the representation of the cantilever-sample interaction force as a polynomial expansion with coefficients that account for the interaction force "stiffness," the cantilever-to-sample energy transfer, and the displacement amplitude of cantilever oscillation. Renormalization of the cantilever beam model shows that for a given cantilever drive frequency cantilever dynamics can be accurately represented by a single nonlinear mass-spring model with frequency-dependent stiffness and damping coefficients [S. A. Cantrell and J. H. Cantrell, J. Appl. Phys. 110, 094314 (2011)]. Application of the Melnikov method to the renormalized dynamical equation is shown to predict a cascade of period doubling bifurcations with increasing cantilever drive force that terminates in chaos. The threshold value of the drive force necessary to initiate bifurcation is shown to depend strongly on the cantilever setpoint and drive frequency, effective damping coefficient, nonlinearity of the cantilever-sample interaction force, and the displacement amplitude of cantilever oscillation. The model predicts the experimentally observed interruptions of the bifurcation cascade for cantilevers of sufficiently large stiffness. Operational factors leading to the loss of image quality in dynamic atomic force microscopy are addressed, and guidelines for optimizing scan stability are proposed using a quantitative analysis based on system dynamical parameters and choice of feedback loop parameter.

  3. Interplay between radiation pressure force and scattered light intensity in the cooperative scattering by cold atoms

    CERN Document Server

    Bienaime, Tom; Chabe, Julien; Rouabah, Mohamed-Taha; Bellando, Louis; Courteille, Philippe W; Piovella, Nicola; Kaiser, Robin

    2013-01-01

    The interplay between the superradiant emission of a cloud of cold two-level atoms and the radiation pressure force is discussed. Using a microscopic model of coupled atomic dipoles driven by an external laser, the radiation field and the average radiation pressure force are derived. A relation between the far-field scattered intensity and the force is derived, using the optical theorem. Finally, the scaling of the sample scattering cross section with the parameters of the system is studied.

  4. Arrays of microscopic magnetic traps for cold atoms and their applications in atom optics

    Institute of Scientific and Technical Information of China (English)

    印建平; 高伟建; 胡建军

    2002-01-01

    A single microscopic magnetic trap for neutral atoms using planar current-carrying wires was proposed and studiedtheoretically by Weinstein et al. In this paper, we propose three structures of composite current-carrying wires to provide1D, 2D and 3D arrays of microscopic magnetic traps for cold alkali atoms. The spatial distributions of magnetic fieldsgenerated by these structures are calculated and the field gradient and curvature in each single microtrap are analysed.Our study shows that arrays of microscopic magnetic traps can be used to provide 1D, 2D or 3D atomic magneticlattices, and even to realize 1D, 2D and 3D arrays of magneto-optical traps, and so on.

  5. Demonstration of atomic scale stick-slip events stimulated by the force versus distance mode using atomic force microscopy

    Science.gov (United States)

    Watson, Gregory S.; Dinte, Bradley P.; Blach, Jolanta A.; Myhra, Sverre

    2002-08-01

    It has been shown that longitudinal deformation of the force-sensing/imposing lever can be stimulated by the conventional force versus distance (F-d), analytical mode of a scanning force microscope. Accordingly it is possible to measure simultaneously both in-plane and out-of-plane force components acting between a tip and a surface. Discrete atomic scale stick-slip events have been observed by F-d generated friction loop analysis of cleaved WTe2, Mica and HOPG single crystals, and of a Langmuir-Blodgett film. Due to the lever geometry, the lateral resolution arising from z-stage movement is better by an order of magnitude than that obtained from translation of the x-y-stage.

  6. Independent analysis of mechanical data from atomic force microscopy

    International Nuclear Information System (INIS)

    Present atomic force microscopes are capable of acquiring large data volumes by point using point force–distance spectroscopic measurements. Even if different trade names and different technical implementations are used, for most of these techniques a force–distance curve in every image pixel is measured, this curve is immediately fitted by some theoretical dependence and results are displayed as a mechanical properties channel (Young modulus, adhesion, etc). Results are processed during the measurement directly in the scanning probe microscopy controller or, after it, by manufacturer provided software. In this paper, we present a software tool for independent numerical processing of such data, including more numerical models for the force–distance curve evaluation and including a simple estimate of uncertainties related to the fitting procedure. This can improve the reliability and the analytical possibilities of mechanical properties mapping methods in an atomic force microscopy. (paper)

  7. Is atomic-scale dissipation in NC-AFM real? Investigation using virtual atomic force microscopy

    International Nuclear Information System (INIS)

    Using a virtual dynamic atomic force microscope, that explicitly simulates the operation of a non-contact AFM experiment, we have performed calculations to investigate the formation of atomic-scale contrast in dissipation images. A non-conservative tip-surface interaction was implemented using the theory of dynamical response in scanning probe microscopy with energies and barriers derived from realistic atomistic modelling. It is shown how contrast in the damping signal is due to the hysteresis in the tip-surface force and not an artefact of the finite response of the complicated instrumentation. Topography and dissipation images of the CaO(001) surface are produced which show atomic-scale contrast in the dissipation with a corrugation of approximately 0.1 eV, which is typical of that observed in images of similar binary ionic surfaces. The effect of the fast-direction scanning speed on the image formation is also investigated and discussed

  8. Influence of scanning force microscope loading force on measurement of ion—track diameter

    Institute of Scientific and Technical Information of China (English)

    WangYu-Gang; AckermannJ; 等

    1997-01-01

    Scanning force microscope(SFM) was operated in the lateral-force mode with different loading forces.The mica samples were irradiated by Se ions with a kinetic energy of 11.4MeV/u.The"full-height width" and the "half-height width" of track profiles were used to evaluate the ion-track diameter,For the former method,the average track diameter increases slowly with increasing loading force between SFM tip and sample.For the later method,the average diameters of ion track nearly keep a common value as the SFM loading force increases.

  9. Reconstruction of Undersampled Atomic Force Microscopy Images

    DEFF Research Database (Denmark)

    Jensen, Tobias Lindstrøm; Arildsen, Thomas; Østergaard, Jan;

    2013-01-01

    Atomic force microscopy (AFM) is one of the most advanced tools for high-resolution imaging and manipulation of nanoscale matter. Unfortunately, standard AFM imaging requires a timescale on the order of seconds to minutes to acquire an image which makes it complicated to observe dynamic processes...

  10. Recognizing nitrogen dopant atoms in graphene using atomic force microscopy

    Science.gov (United States)

    van der Heijden, Nadine J.; Smith, Daniël; Calogero, Gaetano; Koster, Rik S.; Vanmaekelbergh, Daniel; van Huis, Marijn A.; Swart, Ingmar

    2016-06-01

    Doping graphene by heteroatoms such as nitrogen presents an attractive route to control the position of the Fermi level in the material. We prepared N-doped graphene on Cu(111) and Ir(111) surfaces via chemical vapor deposition of two different molecules. Using scanning tunneling microscopy images as a benchmark, we show that the position of the dopant atoms can be determined using atomic force microscopy. Specifically, the frequency shift-distance curves Δ f (z ) acquired above a N atom are significantly different from the curves measured over a C atom. Similar behavior was found for N-doped graphene on Cu(111) and Ir(111). The results are corroborated by density functional theory calculations employing a van der Waals functional.

  11. Advances in Atomic Force Microscopy and Scanning Tunneling Microscopy

    Science.gov (United States)

    Albrecht, Thomas Robert

    The scanning tunneling microscope (STM) and the more recently developed atomic force microscope (AFM) are high resolution scanning probe microscopes capable of three dimensional atomic-scale surface profiling. In the AFM, minute forces acting between the tip of a flexible cantilever stylus and the surface of the sample cause deflections of the cantilever which are detected by a tunneling or optical sensor with subangstrom sensitivity. The AFM work presented here involves surface profiling via repulsive contact forces between 10^{-6} and 10^{-9} N in magnitude. In this contact profiling (repulsive) mode the AFM is capable of atomic resolution on both electrically conducting and insulating surfaces (unlike the STM). AFM instrumentation for room temperature and low temperature operation is discussed. The critical component of the AFM is the cantilever stylus assembly, which should have a small mass. Several microfabrication processes have been developed to produce thin film SiO_2 and Si_3N_4 microcantilevers with integrated sharp tips. Atomic resolution has been achieved with the AFM in air on a number of samples, including graphite, MoS _2, TaSe_2, WTe_2, TaS_2, and BN (the first insulator imaged with atomic resolution by any means). Various organic and molecular samples have been imaged with nanometer resolution. The difference between STM and AFM response is shown in images of TaS _2 (a charge density wave material), and in simultaneous STM/AFM images of lattice defects and adsorbates on graphite and MoS_2. A number of artifacts make STM and AFM image interpretation subtle, such as tip shape effects, frictional effects, and tracking in atomic grooves. STM images of moire patterns near grain boundaries confirm the importance of tip shape effects. Various surface modification and lithography techniques have been demonstrated with the STM and AFM, including an STM voltage pulse technique which reproducibly creates 40 A diameter holes on the surface of graphite, and a

  12. Origin of current-induced forces in an atomic gold wire: A first-principles study

    DEFF Research Database (Denmark)

    Brandbyge, Mads; Stokbro, Kurt; Taylor, Jeremy Philip;

    2003-01-01

    We address the microscopic origin of the current-induced forces by analyzing results of first principles density functional calculations of atomic gold wires connected to two gold electrodes with different electrochemical potentials. We find that current induced forces are closely related to the ...

  13. A method based on optical and atomic force microscopes for instant imaging of non-homogeneous electro-mechanical processes and direct estimation of dij coefficients in piezoelectric materials at the local level

    International Nuclear Information System (INIS)

    Highlights: • Non-homogeneous electro-mechanical properties of piezoelectric materials. • Local method for estimation of piezoelectric coefficients. • Spatial variation of piezoelectric coefficients. - Abstract: Ferroelectric materials have attracted much interest due to their wide and important technological applications. Regarding their piezoelectric properties, these materials are evaluated by means of relatively complicate global methods. In this work a comparatively simple and efficient local method for the direct estimation of the dij coefficients is presented. The method is based on conventional optical microscopy (OM) and advanced Atomic Force Microscopy (AFM) employed to image the local deformation of a specimen upon variation of a dc electric field. The feasibility and reliability of the method is demonstrated at room temperature in single crystals of (1−x)Pb(Mg1/3Nb2/3)O3–xPbTiO3. Non-homogeneous electro-mechanical processes are detected. Accordingly, the estimated dij coefficients exhibit a spatial variation over the crystal surface. Except for electro-mechanical systems, the introduced local method could find wide application for the investigation of spatially non-homogeneous properties that possibly exist in relevant magneto-mechanical and thermo-mechanical complex systems

  14. Measurement of inter-particle forces by an interfacial force microscope

    Institute of Scientific and Technical Information of China (English)

    Qing Huang; Asghar Mesbah-Nejad; Seyed M. Tadayyon; Peter Norton; Hui Zhang; Jesse Zhu

    2010-01-01

    An inteffacial force microscope (IFM) was employed to measure the inter-particle forces between two individual glass beads with diameters varying from 8 to 20 μm. With the feedback function of IFM turned off, attractive forces were obtained. The forces varied in the range of 0.1-0.34 μN, and their validity was confirmed by a theoretical analysis of the van der Waals force between the same glass beads. With the feedback function switched on, no attractive forces between particles were detected by the IFM when the probe approached the sample substrate. This may be attributed to the dramatic change of the attractive forces within a very short separation distance and/or the relatively poor signal-to-noise ratio of the IFM.

  15. Graphene control cutting using an atomic force microscope based nanorobot%基于原子力显微镜的石墨烯可控裁剪方法研究

    Institute of Scientific and Technical Information of China (English)

    张嵛; 刘连庆; 席宁; 王越超; 董再励

    2012-01-01

    石墨烯是一种新奇的纳米材料,其电学特性与几何构型密切相关,因此特定几何构型的加工技术是石墨烯基纳米器件走入实际应用的关键.然而迄今为止,还没有能够快速、低成本实现上述目标的方法.本文提出了一种基于原子力显微镜(AFM)机械切割的石墨烯裁剪方法,实现了各种石墨烯纳米结构如纳米带、三角形等的可控加工;探索了载荷与裁剪效果之间的关系,同时结合旋转基底法实现了AFM针尖效应对切割力检测影响的有效克服,在理论和实验上系统研究了晶格切割方向对纳米切割力大小的影响.本研究表明实时切割力可以作为纳米加工过程的状态反馈信息来指引纳米切割的进行,这为实现晶格精度的石墨烯可控加工奠定了理论与实验基础,由于该方法还具有与并行探针相兼容的优点,因此有望在规模化、批量化、低成本的石墨烯基纳米器件制造中发挥重要作用.%The electrical properties of graphene strongly rely on its size, geometry and edge structure. Therefore, the ability of fabricaiing graphene into desired configuration is one of the enabled techniques to manufacture graphene-based nanodevices and push ii into practical applications. However, there is no effective way to achieve this goal till today. In this paper, an Atomic Force Microscopy (AFM) based mechanical cutting method is developed to meet the urgent need of graphene fabrication. Theoretical analysis between cutting force and lattice cutting angle is carried out, which reveals that the value of the cutting force is related with the graphene cutting direction. Different graphene shapes are fabricated to demonstrate the efficiency and effectiveness of the proposed method. Furthermore, after many times of cutting experiments with the rotation sample method, we proved that the cutting forces do vary with the lattice cutting direction. The experimental results keep consistent

  16. Energy dissipation in multifrequency atomic force microscopy.

    Science.gov (United States)

    Pukhova, Valentina; Banfi, Francesco; Ferrini, Gabriele

    2014-01-01

    The instantaneous displacement, velocity and acceleration of a cantilever tip impacting onto a graphite surface are reconstructed. The total dissipated energy and the dissipated energy per cycle of each excited flexural mode during the tip interaction is retrieved. The tip dynamics evolution is studied by wavelet analysis techniques that have general relevance for multi-mode atomic force microscopy, in a regime where few cantilever oscillation cycles characterize the tip-sample interaction. PMID:24778976

  17. Energy dissipation in multifrequency atomic force microscopy

    Directory of Open Access Journals (Sweden)

    Valentina Pukhova

    2014-04-01

    Full Text Available The instantaneous displacement, velocity and acceleration of a cantilever tip impacting onto a graphite surface are reconstructed. The total dissipated energy and the dissipated energy per cycle of each excited flexural mode during the tip interaction is retrieved. The tip dynamics evolution is studied by wavelet analysis techniques that have general relevance for multi-mode atomic force microscopy, in a regime where few cantilever oscillation cycles characterize the tip–sample interaction.

  18. Comparison of DC and AC Transport in 1.5-7.5 nm Oligophenylene Imine Molecular Wires across Two Junction Platforms: Eutectic Ga-In versus Conducting Probe Atomic Force Microscope Junctions.

    Science.gov (United States)

    Sangeeth, C S Suchand; Demissie, Abel T; Yuan, Li; Wang, Tao; Frisbie, C Daniel; Nijhuis, Christian A

    2016-06-15

    We have utilized DC and AC transport measurements to measure the resistance and capacitance of thin films of conjugated oligophenyleneimine (OPI) molecules ranging from 1.5 to 7.5 nm in length. These films were synthesized on Au surfaces utilizing the imine condensation chemistry between terephthalaldehyde and 1,4-benzenediamine. Near edge X-ray absorption fine structure (NEXAFS) spectroscopy yielded molecular tilt angles of 33-43°. To probe DC and AC transport, we employed Au-S-OPI//GaOx/EGaIn junctions having contact areas of 9.6 × 10(2) μm(2) (10(9) nm(2)) and compared to previously reported DC results on the same OPI system obtained using Au-S-OPI//Au conducting probe atomic force microscopy (CP-AFM) junctions with 50 nm(2) areas. We found that intensive observables agreed very well across the two junction platforms. Specifically, the EGaIn-based junctions showed: (i) a crossover from tunneling to hopping transport at molecular lengths near 4 nm; (ii) activated transport for wires >4 nm in length with an activation energy of 0.245 ± 0.008 eV for OPI-7; (iii) exponential dependence of conductance with molecular length with a decay constant β = 2.84 ± 0.18 nm(-1) (DC) and 2.92 ± 0.13 nm(-1) (AC) in the tunneling regime, and an apparent β = 1.01 ± 0.08 nm(-1) (DC) and 0.99 ± 0.11 nm(-1) (AC) in the hopping regime; (iv) previously unreported dielectric constant of 4.3 ± 0.2 along the OPI wires. However, the absolute resistances of Au-S-OPI//GaOx/EGaIn junctions were approximately 100 times higher than the corresponding CP-AFM junctions due to differences in metal-molecule contact resistances between the two platforms.

  19. Comparison of DC and AC Transport in 1.5-7.5 nm Oligophenylene Imine Molecular Wires across Two Junction Platforms: Eutectic Ga-In versus Conducting Probe Atomic Force Microscope Junctions.

    Science.gov (United States)

    Sangeeth, C S Suchand; Demissie, Abel T; Yuan, Li; Wang, Tao; Frisbie, C Daniel; Nijhuis, Christian A

    2016-06-15

    We have utilized DC and AC transport measurements to measure the resistance and capacitance of thin films of conjugated oligophenyleneimine (OPI) molecules ranging from 1.5 to 7.5 nm in length. These films were synthesized on Au surfaces utilizing the imine condensation chemistry between terephthalaldehyde and 1,4-benzenediamine. Near edge X-ray absorption fine structure (NEXAFS) spectroscopy yielded molecular tilt angles of 33-43°. To probe DC and AC transport, we employed Au-S-OPI//GaOx/EGaIn junctions having contact areas of 9.6 × 10(2) μm(2) (10(9) nm(2)) and compared to previously reported DC results on the same OPI system obtained using Au-S-OPI//Au conducting probe atomic force microscopy (CP-AFM) junctions with 50 nm(2) areas. We found that intensive observables agreed very well across the two junction platforms. Specifically, the EGaIn-based junctions showed: (i) a crossover from tunneling to hopping transport at molecular lengths near 4 nm; (ii) activated transport for wires >4 nm in length with an activation energy of 0.245 ± 0.008 eV for OPI-7; (iii) exponential dependence of conductance with molecular length with a decay constant β = 2.84 ± 0.18 nm(-1) (DC) and 2.92 ± 0.13 nm(-1) (AC) in the tunneling regime, and an apparent β = 1.01 ± 0.08 nm(-1) (DC) and 0.99 ± 0.11 nm(-1) (AC) in the hopping regime; (iv) previously unreported dielectric constant of 4.3 ± 0.2 along the OPI wires. However, the absolute resistances of Au-S-OPI//GaOx/EGaIn junctions were approximately 100 times higher than the corresponding CP-AFM junctions due to differences in metal-molecule contact resistances between the two platforms. PMID:27172452

  20. From atoms to steps: The microscopic origins of crystal evolution

    Science.gov (United States)

    Patrone, Paul N.; Einstein, T. L.; Margetis, Dionisios

    2014-07-01

    The Burton-Cabrera-Frank (BCF) theory of crystal growth has been successful in describing a wide range of phenomena in surface physics. Typical crystal surfaces are slightly misoriented with respect to a facet plane; thus, the BCF theory views such systems as composed of staircase-like structures of steps separating terraces. Adsorbed atoms (adatoms), which are represented by a continuous density, diffuse on terraces, and steps move by absorbing or emitting these adatoms. Here we shed light on the microscopic origins of the BCF theory by deriving a simple, one-dimensional (1D) version of the theory from an atomistic, kinetic restricted solid-on-solid (KRSOS) model without external material deposition. We define the time-dependent adatom density and step position as appropriate ensemble averages in the KRSOS model, thereby exposing the non-equilibrium statistical mechanics origins of the BCF theory. Our analysis reveals that the BCF theory is valid in a low adatom-density regime, much in the same way that an ideal gas approximation applies to dilute gasses. We find conditions under which the surface remains in a low-density regime and discuss the microscopic origin of corrections to the BCF model.

  1. Heating-Assisted Atom Transfer in the Scanning Tunneling Microscope

    CERN Document Server

    Grigorescu, M

    1998-01-01

    The effects of a voltage pulse on the localization probability for a Xe atom prepared in a pure state localized on the STM surface at 0 temperature is investigated by numerically integrating the time-dependent Schroedinger equation. In these calculations the environmental interactions are neglected, and voltage pulses of 20 and 7 ns with symmetric triangular and trapezoidal shapes are considered. The atom dynamics at an environmental temperature of 4 K is studied in the frame of a stochastic, non-linear Liouville equation for the density operator. It is shown that the irreversible transfer from surface to tip may be explained by thermal decoherence rather than by the driving force acting during the application of the voltage pulse.

  2. Microtensile Tests Using In Situ Atomic Force Microscopy

    Science.gov (United States)

    Lang, Udo; Dual, Jurg

    In recent years a new field in the micromechanical characterization of materials has emerged. Researchers started to integrate atomic force microscopes (AFM) into microtensile tests. This allowed to investigate surface deformation of layers with thicknesses in the range of micrometers. In the first part of this article experiments on organic samples are presented followed by developments on anorganic specimens. In the second part of the paper latest developments at the Center of Mechanics of ETH Zurich are presented. The setup allows to monitor crack growth with micrometer resolution. At the same time forces can be measured in the millinewton range. Specimens are made from photodefinable polyimide. The stress-crack- length diagrams of two experiments are presented which enables to identify different stages of crack growth and therefore of fracture behaviour. Finally, possible extensions of the setup employing digital image correlation (DIC) are envisioned by analyzing the displacement field around the crack tip.

  3. Taking nanomedicine teaching into practice with atomic force microscopy and force spectroscopy.

    Science.gov (United States)

    Carvalho, Filomena A; Freitas, Teresa; Santos, Nuno C

    2015-12-01

    Atomic force microscopy (AFM) is a useful and powerful tool to study molecular interactions applied to nanomedicine. The aim of the present study was to implement a hands-on atomic AFM course for graduated biosciences and medical students. The course comprises two distinct practical sessions, where students get in touch with the use of an atomic force microscope by performing AFM scanning images of human blood cells and force spectroscopy measurements of the fibrinogen-platelet interaction. Since the beginning of this course, in 2008, the overall rating by the students was 4.7 (out of 5), meaning a good to excellent evaluation. Students were very enthusiastic and produced high-quality AFM images and force spectroscopy data. The implementation of the hands-on AFM course was a success, giving to the students the opportunity of contact with a technique that has a wide variety of applications on the nanomedicine field. In the near future, nanomedicine will have remarkable implications in medicine regarding the definition, diagnosis, and treatment of different diseases. AFM enables students to observe single molecule interactions, enabling the understanding of molecular mechanisms of different physiological and pathological processes at the nanoscale level. Therefore, the introduction of nanomedicine courses in bioscience and medical school curricula is essential.

  4. Atomic force microscopy-based shape analysis of heart mitochondria.

    Science.gov (United States)

    Lee, Gi-Ja; Park, Hun-Kuk

    2015-01-01

    Atomic force microscopy (AFM) has become an important medical and biological tool for the noninvasive imaging of cells and biomaterials in medical, biological, and biophysical research. The major advantages of AFM over conventional optical and electron microscopes for bio-imaging include the facts that no special coating is required and that imaging can be done in all environments-air, vacuum, or aqueous conditions. In addition, it can also precisely determine pico-nano Newton force interactions between the probe tip and the sample surface from force-distance curve measurements.It is widely known that mitochondrial swelling is one of the most important indicators of the opening of the mitochondrial permeability transition (MPT) pore. As mitochondrial swelling is an ultrastructural change, quantitative analysis of this change requires high-resolution microscopic methods such as AFM. Here, we describe the use of AFM-based shape analysis for the characterization of nanostructural changes in heart mitochondria resulting from myocardial ischemia-reperfusion injury. PMID:25634291

  5. Force dependent metalloprotein conductance by conducting atomic force microscopy

    Science.gov (United States)

    Zhao, Jianwei; Davis, Jason J.

    2003-09-01

    Our ability to analyse charge transport through a biological macromolecule, pertinent to our understanding not only of biological redox processes but also, for example, to our interpretation of tunnelling imaging, remains a significant practical and theoretical issue. Though much information can be gained by carrying out such examinations at a molecular level, there exist few methods where such controlled analyses are, in fact, feasible. Here we report on the electron transport characteristics of a blue copper metalloprotein as characterized at a refined level by conductive-probe atomic force microscopy. The modulation of this conductance with compressional force has also been examined. Though highly resistive, observations are consistent with the ability of the protein matrix to mediate appreciable tunnelling current. This work, then, paves the way for designed implementation of biomacromolecules into electronic devices.

  6. Atomic force microscopy and scanning electron microscopic study on the fluorosis of enamel in rats%氟影响大鼠牙釉质发育的扫描电镜和原子力显微镜观察

    Institute of Scientific and Technical Information of China (English)

    陈黎明; 汤晔; 唐杰

    2015-01-01

    Objective To investigate the ultrastructure of enamel in the mandibular incisor tooth in a rat model of dental fluorosis.Methods Thirty 5-week-old male and female rats of SD strain were divided into three groups of ten.The animals in the control group were maintained for 8 weeks on pure deionized water,in the low-fluoride group deionized water with 22.5 mg/L of fluorine(50 mg/L NaF) was used,and in the high-fluoride group deionized water with 45 mg/L of fluorine(100 mg/L NaF) was used.All specimens examined were obtained from the mandibular incisors.Mid-sagittal ground sections were prepared from the direction of incisal point of each incisor for scanning electron microscopy(SEM) and atomic force microscopy (AFM).Results According to the SEM results,the prisms in the control group had a complete and clear column structure with closely packed enamel rods or enamel prisms.The prisms in the high-fluoride experimental group were collapsed and showed curved and fractured crystallites.The level of prism structural changes in the low-fluoride experimental group was in between that of the control group and the high-fluoride group.AFM for the middle layer enamel showed an average roughness(Ra) of (550.6±32.0) nm in the control group,(415.0±24.2) nm in the low-fluoride group,and (194.3± 11.3) nm for the high-fluoride group.There was significant difference between the high-fluoride group and the control group(P<0.05).Conclusions Formation of rat enamel in the high fluoride environment presented obvious structural collapse and no clearance between prisms.Such changes appear to indicate a loss of normal prism structure in rat enamels from exposure to high levels of fluorine during the maturation period.%目的 观察大鼠氟斑牙模型下颌切牙釉质的超微结构,探讨过量氟对牙体微观结构的影响.方法 30只5周龄SD大鼠雌雄各半,均分为3组,对照组用不含氟的去离子水喂养,低氟组用含22.5 mg/L F-(50 mg/L NaF)、高氟组用含45 mg

  7. Nonlinear Dynamics of Cantilever Tip-Sample Surface Interactions in Atomic Force Microscopy

    OpenAIRE

    Cantrell, John H.; Cantrell, Sean A.

    2010-01-01

    The various dynamical implementations of the atomic force microscope have become important nanoscale characterization tools for the development of novel materials and devices. One of the most significant factors affecting all dynamical AFM modalities is the cantilever tip-sample surface interaction force. We have developed a detailed mathematical model of this interaction that includes a quantitative consideration of the nonlinearity of the interaction force as a function of the cantilever ti...

  8. Periodicity in bimodal atomic force microscopy

    Energy Technology Data Exchange (ETDEWEB)

    Lai, Chia-Yun; Santos, Sergio, E-mail: santos-en@yahoo.com; Chiesa, Matteo [Laboratory for Energy and NanoScience (LENS), Institute Center for Future Energy (iFES), Masdar Institute of Science and Technology, Abu Dhabi (United Arab Emirates); Barcons, Victor [Departament de Disseny i Programació de Sistemes Electrònics, UPC - Universitat Politècnica de Catalunya, Av. Bases, 61, 08242 Manresa (Barcelona) (Spain)

    2015-07-28

    Periodicity is fundamental for quantification and the application of conservation principles of many important systems. Here, we discuss periodicity in the context of bimodal atomic force microscopy (AFM). The relationship between the excited frequencies is shown to affect and control both experimental observables and the main expressions quantified via these observables, i.e., virial and energy transfer expressions, which form the basis of the bimodal AFM theory. The presence of a fundamental frequency further simplifies the theory and leads to close form solutions. Predictions are verified via numerical integration of the equation of motion and experimentally on a mica surface.

  9. Friction forces on atoms after acceleration

    International Nuclear Information System (INIS)

    The aim of this paper is to revisit the calculation of atom–surface quantum friction in the quantum field theory formulation put forward by Barton (2010 New J. Phys. 12 113045). We show that the power dissipated into field excitations and the associated friction force depend on how the atom is boosted from being initially at rest to a configuration in which it is moving at constant velocity (v) parallel to the planar interface. In addition, we point out that there is a subtle cancellation between the one-photon and part of the two-photon dissipating power, resulting in a leading order contribution to the frictional power which goes as v4. These results are also confirmed by an alternative calculation of the average radiation force, which scales as v3. (paper)

  10. Rectified optical force on dark-state atoms

    Science.gov (United States)

    Korsunsky, E. A.; Kosachiov, D. V.

    1997-12-01

    We show that an imperfection of velocity-selective coherent population trapping (VSCPT) in three-level atoms excited by standing light waves causes a rectified force on cooled atoms. The rectified force as well as the cooling force are calculated both analytically and numerically for 0953-4075/30/24/010/img5 and cascade three-level systems. Combination of these forces with the VSCPT mechanism can lead to localization of very cold atoms in potential wells created by the rectified force. This effect should be taken into account in experiments with VSCPT in standing waves, and can be used for realizing superlattices of cold atoms, in particular, cold Rydberg atoms.

  11. Electrical resistivity of polypyrrole nanotube measured by conductive scanning probe microscope: The role of contact force

    Science.gov (United States)

    Park, J. G.; Lee, S. H.; Kim, B.; Park, Y. W.

    2002-12-01

    Polypyrrole (PPy) nanotubes were synthesized using the pores of track-etched polycarbonate membrane as a template. Its size depends on the pore diameter of template, range from 50 to 200 nm. Direct I-V measurements of PPy nanotube (diameter of 120 nm) deposited on Au were done using a metal-coated tapping-mode atomic-force-microscope tip. Linear I-V characteristics are observed, and the resistance is decreased as the contact force is increased. Using the Hertz model, the elastic modulus E and electrical resistivity ρ are estimated to be E˜1 GPa and ρ˜1 Ωcm. These values are consistent with those obtained in bulk PPy film.

  12. Envejecimiento de Almidones Termoplásticos Agrios de Yuca y Nativos de Papa por Microscopía de Fuerza Atómica Ageing of Sour Cassava and Native Potato Thermoplastic Starches by Atomic Force Microscopy

    OpenAIRE

    Harold A Acosta; Héctor S Villada; Pedro A Prieto

    2006-01-01

    En este trabajo, se determinó la topografía de almidones termoplásticos (TPS) agrio de yuca y nativo de papa, mediante microscopía de fuerza atómica (AFM), durante un periodo de 120 días de almacenamiento. Mezclas de almidones agrios (fermentados) de yuca y nativo de papa, y glicerina, se procesaron en un extrusor de husillo sencillo. Láminas de TPS agrio de yuca (SCTPS) y nativo de papa (NPTPS), se observaron y midieron por AFM (en modo contacto). Sus superficies mostraron incremento en rugo...

  13. Investigating cell mechanics with atomic force microscopy.

    Science.gov (United States)

    Haase, Kristina; Pelling, Andrew E

    2015-03-01

    Transmission of mechanical force is crucial for normal cell development and functioning. However, the process of mechanotransduction cannot be studied in isolation from cell mechanics. Thus, in order to understand how cells 'feel', we must first understand how they deform and recover from physical perturbations. Owing to its versatility, atomic force microscopy (AFM) has become a popular tool to study intrinsic cellular mechanical properties. Used to directly manipulate and examine whole and subcellular reactions, AFM allows for top-down and reconstitutive approaches to mechanical characterization. These studies show that the responses of cells and their components are complex, and largely depend on the magnitude and time scale of loading. In this review, we generally describe the mechanotransductive process through discussion of well-known mechanosensors. We then focus on discussion of recent examples where AFM is used to specifically probe the elastic and inelastic responses of single cells undergoing deformation. We present a brief overview of classical and current models often used to characterize observed cellular phenomena in response to force. Both simple mechanistic models and complex nonlinear models have been used to describe the observed cellular behaviours, however a unifying description of cell mechanics has not yet been resolved. PMID:25589563

  14. Atomic Force Microscopy for Soil Analysis

    Science.gov (United States)

    gazze, andrea; doerr, stefan; dudley, ed; hallin, ingrid; matthews, peter; quinn, gerry; van keulen, geertje; francis, lewis

    2016-04-01

    Atomic Force Microscopy (AFM) is a high-resolution surface-sensitive technique, which provides 3-dimensional topographical information and material properties of both stiff and soft samples in their natural environments. Traditionally AFM has been applied to samples with low roughness: hence its use for soil analysis has been very limited so far. Here we report the optimization settings required for a standardization of high-resolution and artefact-free analysis of natural soil with AFM: soil immobilization, AFM probe selection, artefact recognition and minimization. Beyond topography, AFM can be used in a spectroscopic mode to evaluate nanomechanical properties, such as soil viscosity, stiffness, and deformation. In this regards, Bruker PeakForce-Quantitative NanoMechanical (QNM) AFM provides a fast and convenient way to extract physical properties from AFM force curves in real-time to obtain soil nanomechanical properties. Here we show for the first time the ability of AFM to describe the topography of natural soil at nanometre resolution, with observation of micro-components, such as clays, and of nano-structures, possibly of biotic origin, the visualization of which would prove difficult with other instrumentations. Finally, nanomechanical profiling has been applied to different wettability states in soil and the respective physical patterns are discussed.

  15. Quantification of Staphylococcus aureus adhesion forces on various dental restorative materials using atomic force microscopy

    Science.gov (United States)

    Merghni, Abderrahmen; Kammoun, Dorra; Hentati, Hajer; Janel, Sébastien; Popoff, Michka; Lafont, Frank; Aouni, Mahjoub; Mastouri, Maha

    2016-08-01

    In the oral cavity dental restorative biomaterials can act as a reservoir for infection with opportunistic Staphylococcus aureus pathogen, which can lead to the occurrence of secondary caries and treatment failures. Our aim was to evaluate the adhesion forces by S. aureus on four dental restorative biomaterials and to correlate this finding to differences in specific surface characteristics. Additionally, the influence of salivary conditioning films in exerted adhesion forces was investigated. The substrate hydrophobicity was measured by goniometer and the surface free energy was calculated using the equilibrium advancing contact angle values of water, formamide, and diiodomethane on the tested surfaces. The surface roughness was determined using atomic force microscope (AFM). Additionally, cell force spectroscopy was achieved to quantify the forces that drive cell-substrate interactions. S. aureus bacterium exerted a considerable adhesion forces on various dental restorative materials, which decreased in the presence of saliva conditioning film. The influence of the surface roughness and free energy in initial adhesion appears to be more important than the effect of hydrophobicity, either in presence or absence of saliva coating. Hence, control of surface properties of dental restorative biomaterials is of crucial importance in preventing the attachment and subsequent the biofilm formation.

  16. An optical near-held microscope based on optical dimensional resonances of interacting atoms

    NARCIS (Netherlands)

    Gadomsky, ON; Moiseev, KY

    2002-01-01

    A concept was suggested for an optical near-field microscope based on optical dimensional resonances in the system of a needle tip atom + a sample atom. High sensitivity and spatial resolution of an order of 1 nm were shown to be characteristic of this microscope. Furthermore, the instrument is appl

  17. Mechanical manifestations of rare atomic jumps in dynamic force microscopy

    Science.gov (United States)

    Hoffmann, R.; Baratoff, A.; Hug, H. J.; Hidber, H. R.; Löhneysen, H. v.; Güntherodt, H.-J.

    2007-10-01

    The resonance frequency and the excitation amplitude of a silicon cantilever have been measured as a function of distance to a cleaved KBr(001) surface with a low-temperature scanning force microscope (SFM) in ultrahigh vacuum. We identify two regimes of tip-sample distances. Above a site-dependent critical tip-sample distance reproducible data with low noise and no interaction-induced energy dissipation are measured. In this regime reproducible SFM images can be recorded. At closer tip-sample distances, above two distinct atomic sites, the frequency values jump between two limiting curves on a timescale of tens of milliseconds. Furthermore, additional energy dissipation occurs wherever jumps are observed. We attribute both phenomena to rarely occurring changes in the tip apex configuration which are affected by short-range interactions with the sample. Their respective magnitudes are related to each other. A specific candidate two-level system is also proposed.

  18. Use of atomic force microscopy to quantify slip irreversibility in a nickel-base superalloy

    Energy Technology Data Exchange (ETDEWEB)

    Risbet, M.; Feaugas, X.; Guillemer-Neel, C.; Clavel, M

    2003-09-15

    Atomic force microscopy was used to study the evolution of surface deformation during cyclic loading in a nickel-base superalloy. Cyclic slip irreversibility has been investigated using quantitative evaluation of extrusion heights and inter-band spacing. This approach is applied to formulate a microscopic crack initiation law, compared to a classical Manson-Coffin relationship.

  19. Use of atomic force microscopy to quantify slip irreversibility in a nickel-base superalloy

    International Nuclear Information System (INIS)

    Atomic force microscopy was used to study the evolution of surface deformation during cyclic loading in a nickel-base superalloy. Cyclic slip irreversibility has been investigated using quantitative evaluation of extrusion heights and inter-band spacing. This approach is applied to formulate a microscopic crack initiation law, compared to a classical Manson-Coffin relationship

  20. STUDY OF MAGNETOSTRICTIVE PROPERTIES OF MATERIALS BY MEANS OF METHOD OF ATOMIC FORCE MICROSCOPY

    Directory of Open Access Journals (Sweden)

    D. A. Stepanenko

    2014-01-01

    Full Text Available The article studies and experimentally proves possibility of application of atomic force microscope for measurement of small magnetostrictive deformations of materials. Exemplary results of measurements for the samples made of technically pure nickel exhibiting strong magnetostrictive effect are presented.

  1. High-frequency multimodal atomic force microscopy

    Directory of Open Access Journals (Sweden)

    Adrian P. Nievergelt

    2014-12-01

    Full Text Available Multifrequency atomic force microscopy imaging has been recently demonstrated as a powerful technique for quickly obtaining information about the mechanical properties of a sample. Combining this development with recent gains in imaging speed through small cantilevers holds the promise of a convenient, high-speed method for obtaining nanoscale topography as well as mechanical properties. Nevertheless, instrument bandwidth limitations on cantilever excitation and readout have restricted the ability of multifrequency techniques to fully benefit from small cantilevers. We present an approach for cantilever excitation and deflection readout with a bandwidth of 20 MHz, enabling multifrequency techniques extended beyond 2 MHz for obtaining materials contrast in liquid and air, as well as soft imaging of delicate biological samples.

  2. Robust atomic force microscopy using multiple sensors.

    Science.gov (United States)

    Baranwal, Mayank; Gorugantu, Ram S; Salapaka, Srinivasa M

    2016-08-01

    Atomic force microscopy typically relies on high-resolution high-bandwidth cantilever deflection measurements based control for imaging and estimating sample topography and properties. More precisely, in amplitude-modulation atomic force microscopy (AM-AFM), the control effort that regulates deflection amplitude is used as an estimate of sample topography; similarly, contact-mode AFM uses regulation of deflection signal to generate sample topography. In this article, a control design scheme based on an additional feedback mechanism that uses vertical z-piezo motion sensor, which augments the deflection based control scheme, is proposed and evaluated. The proposed scheme exploits the fact that the piezo motion sensor, though inferior to the cantilever deflection signal in terms of resolution and bandwidth, provides information on piezo actuator dynamics that is not easily retrievable from the deflection signal. The augmented design results in significant improvements in imaging bandwidth and robustness, especially in AM-AFM, where the complicated underlying nonlinear dynamics inhibits estimating piezo motions from deflection signals. In AM-AFM experiments, the two-sensor based design demonstrates a substantial improvement in robustness to modeling uncertainties by practically eliminating the peak in the sensitivity plot without affecting the closed-loop bandwidth when compared to a design that does not use the piezo-position sensor based feedback. The contact-mode imaging results, which use proportional-integral controllers for cantilever-deflection regulation, demonstrate improvements in bandwidth and robustness to modeling uncertainties, respectively, by over 30% and 20%. The piezo-sensor based feedback is developed using H∞ control framework. PMID:27587128

  3. Robust atomic force microscopy using multiple sensors

    Science.gov (United States)

    Baranwal, Mayank; Gorugantu, Ram S.; Salapaka, Srinivasa M.

    2016-08-01

    Atomic force microscopy typically relies on high-resolution high-bandwidth cantilever deflection measurements based control for imaging and estimating sample topography and properties. More precisely, in amplitude-modulation atomic force microscopy (AM-AFM), the control effort that regulates deflection amplitude is used as an estimate of sample topography; similarly, contact-mode AFM uses regulation of deflection signal to generate sample topography. In this article, a control design scheme based on an additional feedback mechanism that uses vertical z-piezo motion sensor, which augments the deflection based control scheme, is proposed and evaluated. The proposed scheme exploits the fact that the piezo motion sensor, though inferior to the cantilever deflection signal in terms of resolution and bandwidth, provides information on piezo actuator dynamics that is not easily retrievable from the deflection signal. The augmented design results in significant improvements in imaging bandwidth and robustness, especially in AM-AFM, where the complicated underlying nonlinear dynamics inhibits estimating piezo motions from deflection signals. In AM-AFM experiments, the two-sensor based design demonstrates a substantial improvement in robustness to modeling uncertainties by practically eliminating the peak in the sensitivity plot without affecting the closed-loop bandwidth when compared to a design that does not use the piezo-position sensor based feedback. The contact-mode imaging results, which use proportional-integral controllers for cantilever-deflection regulation, demonstrate improvements in bandwidth and robustness to modeling uncertainties, respectively, by over 30% and 20%. The piezo-sensor based feedback is developed using H∞ control framework.

  4. Nanoscale imaging of Bacillus thuringiensis flagella using atomic force microscopy

    Science.gov (United States)

    Gillis, Annika; Dupres, Vincent; Delestrait, Guillaume; Mahillon, Jacques; Dufrêne, Yves F.

    2012-02-01

    Because bacterial flagella play essential roles in various processes (motility, adhesion, host interactions, secretion), studying their expression in relation to function is an important challenge. Here, we use atomic force microscopy (AFM) to gain insight into the nanoscale surface properties of two wild-type and four mutant strains of Bacillus thuringiensis exhibiting various levels of flagellation. We show that, unlike AFM in liquid, AFM in air is a simple and reliable approach to observe the morphological details of the bacteria, and to quantify the density and dimensions of their flagella. We found that the amount of flagella expressed by the six strains, as observed at the nanoscale, correlates with their microscopic swarming motility. These observations provide novel information on flagella expression in Gram-positive bacteria and demonstrate the power of AFM in genetic studies for the fast assessment of the phenotypic characteristics of bacterial strains altered in cell surface appendages.Because bacterial flagella play essential roles in various processes (motility, adhesion, host interactions, secretion), studying their expression in relation to function is an important challenge. Here, we use atomic force microscopy (AFM) to gain insight into the nanoscale surface properties of two wild-type and four mutant strains of Bacillus thuringiensis exhibiting various levels of flagellation. We show that, unlike AFM in liquid, AFM in air is a simple and reliable approach to observe the morphological details of the bacteria, and to quantify the density and dimensions of their flagella. We found that the amount of flagella expressed by the six strains, as observed at the nanoscale, correlates with their microscopic swarming motility. These observations provide novel information on flagella expression in Gram-positive bacteria and demonstrate the power of AFM in genetic studies for the fast assessment of the phenotypic characteristics of bacterial strains altered in

  5. Measurement adhesion force between fine particle and effect of humidity: An study with Atomic Force Microscopy

    International Nuclear Information System (INIS)

    Adhesion force is interaction between particle- particle and particle surface. First Hertz in 1882 calculated adhesion force between spherical particle and planar surface. Adhesion force in interested for scientist and different industries such as paint, foot, pharmaceutical, etc. In this study we measured adhesion force between fine particle such as silica and silicon and mica surface, with Atomic Force Microscopy. The adhesion force measured between particle-planar surfaces with Atomic Force Microscopy on different humidity and simulated results.

  6. Atomic scale imaging and spectroscopy of individual electron trap states using force detected dynamic tunnelling

    International Nuclear Information System (INIS)

    We report the first atomic scale imaging and spectroscopic measurements of electron trap states in completely non-conducting surfaces by dynamic tunnelling force microscopy/spectroscopy. Single electrons are dynamically shuttled to/from individual states in thick films of hafnium silicate and silicon dioxide. The new method opens up surfaces that are inaccessible to the scanning tunnelling microscope for imaging and spectroscopy on an atomic scale.

  7. Nanoscopic oxidation of p-type and un-doped Si (100) surfaces using un-externally biased atomic force microscope tips (AFM) in the presence of selected organic solvents

    Science.gov (United States)

    McCausland, Jeffrey; Withanage, Sajeevi; Mallik, Robert; Lyuksyutov, Sergei

    A conductive un-biased AFM tip oscillating above p-type or un-doped Si (100) treated with toluene, butan-2-ol, and propan-2-ol creates nanostructures ranging in height from 1-100 nm. The tip was oscillated in ambient conditions (30-70% Rel. Humidity) at frequencies in the 102 kHz range. It was repeatable with various concentrations of solvent in aqueous solution. It is suggested that mechanical oscillations of the AFM tip polarizes the solvent molecules deposited on the surface resulting in electron transfer from the tip to the surface followed by feature formation. This process effectively creates an electrochemical cell at the microscopic level and the miscibility of the solvents is the key to enabling the process. Species which ionize during the process may be consumed in irreversible reactions whereas the alcohols act as catalysts and are not consumed. The influence of boron defects in the Si substrates is also discussed. It appears that the observed oxidation is different from all other similar reported phenomena including local anodic oxidation, and chemo-mechanical lithographic techniques utilizing AFM.

  8. Fuzzy logic algorithm to extract specific interaction forces from atomic force microscopy data

    Science.gov (United States)

    Kasas, Sandor; Riederer, Beat M.; Catsicas, Stefan; Cappella, Brunero; Dietler, Giovanni

    2000-05-01

    The atomic force microscope is not only a very convenient tool for studying the topography of different samples, but it can also be used to measure specific binding forces between molecules. For this purpose, one type of molecule is attached to the tip and the other one to the substrate. Approaching the tip to the substrate allows the molecules to bind together. Retracting the tip breaks the newly formed bond. The rupture of a specific bond appears in the force-distance curves as a spike from which the binding force can be deduced. In this article we present an algorithm to automatically process force-distance curves in order to obtain bond strength histograms. The algorithm is based on a fuzzy logic approach that permits an evaluation of "quality" for every event and makes the detection procedure much faster compared to a manual selection. In this article, the software has been applied to measure the binding strength between tubuline and microtubuline associated proteins.

  9. Interaction forces between silica surfaces in cationic surfactant solutions: an atomic force microscopy study.

    Science.gov (United States)

    Lüderitz, Liset A C; v Klitzing, Regine

    2013-07-15

    The interaction forces between silicon oxide surfaces in the presence of surfactant solutions were studied. Based on the qualitative and quantitative analysis of these interaction forces the correlation with the structure of the aggregates on the surfaces is analyzed. A colloidal probe atomic force microscope (AFM) was used to measure the forces between two colloidal silica particles and between a colloidal particle and a silicon wafer in the presence of hexadecyltrimethylammonium bromide (CTAB) at concentrations between 0.005 mM and 1.2 mM. Different interaction forces were obtained for the silica particle-silica particle system when compared to those for the silica particle-silicon wafer system for the same studied concentration. This indicates that the silica particles and the silicon wafer have different aggregate morphologies on their surfaces. The point of zero charge (pzc) was obtained at 0.05 mM CTAB concentration for the silica particles and at 0.3mM for the silica particle-silicon wafer system. This indicates a higher charge at the silicon wafer than at the silica particles. The observed long range attractions are explained by nanobubbles present at the silicon oxide surfaces and/or by attractive electrostatic interactions between the surfaces, induced by oppositely charged patches at the opposing Si oxide surfaces. PMID:23647691

  10. Dynamic nuclear polarization in a magnetic resonance force microscope experiment.

    Science.gov (United States)

    Issac, Corinne E; Gleave, Christine M; Nasr, Paméla T; Nguyen, Hoang L; Curley, Elizabeth A; Yoder, Jonilyn L; Moore, Eric W; Chen, Lei; Marohn, John A

    2016-04-01

    We report achieving enhanced nuclear magnetization in a magnetic resonance force microscope experiment at 0.6 tesla and 4.2 kelvin using the dynamic nuclear polarization (DNP) effect. In our experiments a microwire coplanar waveguide delivered radiowaves to excite nuclear spins and microwaves to excite electron spins in a 250 nm thick nitroxide-doped polystyrene sample. Both electron and proton spin resonance were observed as a change in the mechanical resonance frequency of a nearby cantilever having a micron-scale nickel tip. NMR signal, not observable from Curie-law magnetization at 0.6 T, became observable when microwave irradiation was applied to saturate the electron spins. The resulting NMR signal's size, buildup time, dependence on microwave power, and dependence on irradiation frequency was consistent with a transfer of magnetization from electron spins to nuclear spins. Due to the presence of an inhomogeneous magnetic field introduced by the cantilever's magnetic tip, the electron spins in the sample were saturated in a microwave-resonant slice 10's of nm thick. The spatial distribution of the nuclear polarization enhancement factor ε was mapped by varying the frequency of the applied radiowaves. The observed enhancement factor was zero for spins in the center of the resonant slice, was ε = +10 to +20 for spins proximal to the magnet, and was ε = -10 to -20 for spins distal to the magnet. We show that this bipolar nuclear magnetization profile is consistent with cross-effect DNP in a ∼10(5) T m(-1) magnetic field gradient. Potential challenges associated with generating and using DNP-enhanced nuclear magnetization in a nanometer-resolution magnetic resonance imaging experiment are elucidated and discussed. PMID:26964007

  11. Dynamic nuclear polarization in a magnetic resonance force microscope experiment.

    Science.gov (United States)

    Issac, Corinne E; Gleave, Christine M; Nasr, Paméla T; Nguyen, Hoang L; Curley, Elizabeth A; Yoder, Jonilyn L; Moore, Eric W; Chen, Lei; Marohn, John A

    2016-04-01

    We report achieving enhanced nuclear magnetization in a magnetic resonance force microscope experiment at 0.6 tesla and 4.2 kelvin using the dynamic nuclear polarization (DNP) effect. In our experiments a microwire coplanar waveguide delivered radiowaves to excite nuclear spins and microwaves to excite electron spins in a 250 nm thick nitroxide-doped polystyrene sample. Both electron and proton spin resonance were observed as a change in the mechanical resonance frequency of a nearby cantilever having a micron-scale nickel tip. NMR signal, not observable from Curie-law magnetization at 0.6 T, became observable when microwave irradiation was applied to saturate the electron spins. The resulting NMR signal's size, buildup time, dependence on microwave power, and dependence on irradiation frequency was consistent with a transfer of magnetization from electron spins to nuclear spins. Due to the presence of an inhomogeneous magnetic field introduced by the cantilever's magnetic tip, the electron spins in the sample were saturated in a microwave-resonant slice 10's of nm thick. The spatial distribution of the nuclear polarization enhancement factor ε was mapped by varying the frequency of the applied radiowaves. The observed enhancement factor was zero for spins in the center of the resonant slice, was ε = +10 to +20 for spins proximal to the magnet, and was ε = -10 to -20 for spins distal to the magnet. We show that this bipolar nuclear magnetization profile is consistent with cross-effect DNP in a ∼10(5) T m(-1) magnetic field gradient. Potential challenges associated with generating and using DNP-enhanced nuclear magnetization in a nanometer-resolution magnetic resonance imaging experiment are elucidated and discussed.

  12. Multifunctional hydrogel nano-probes for atomic force microscopy

    Science.gov (United States)

    Lee, Jae Seol; Song, Jungki; Kim, Seong Oh; Kim, Seokbeom; Lee, Wooju; Jackman, Joshua A.; Kim, Dongchoul; Cho, Nam-Joon; Lee, Jungchul

    2016-05-01

    Since the invention of the atomic force microscope (AFM) three decades ago, there have been numerous advances in its measurement capabilities. Curiously, throughout these developments, the fundamental nature of the force-sensing probe--the key actuating element--has remained largely unchanged. It is produced by long-established microfabrication etching strategies and typically composed of silicon-based materials. Here, we report a new class of photopolymerizable hydrogel nano-probes that are produced by bottom-up fabrication with compressible replica moulding. The hydrogel probes demonstrate excellent capabilities for AFM imaging and force measurement applications while enabling programmable, multifunctional capabilities based on compositionally adjustable mechanical properties and facile encapsulation of various nanomaterials. Taken together, the simple, fast and affordable manufacturing route and multifunctional capabilities of hydrogel AFM nano-probes highlight the potential of soft matter mechanical transducers in nanotechnology applications. The fabrication scheme can also be readily utilized to prepare hydrogel cantilevers, including in parallel arrays, for nanomechanical sensor devices.

  13. Haptics and Graphic Analogies for the Understanding of Atomic Force Microscopy

    OpenAIRE

    Millet, Guillaume; LECUYER, Anatole; BURKHARDT, Jean Marie; Haliyo, Sinan; Regnier, Stéphane

    2013-01-01

    This paper aims to evaluate the benefits of using virtual reality and force-feedback to help teaching nanoscale applications. We propose a teaching aid that combines graphic analogies and haptics intended to improve the grasp of non-intuitive nanoscale phenomena for people without prior knowledge of nanophysics. We look specifically at the most important nanophysical phenomenon, namely, the behavior of the probe of an Atomic Force Microscope (AFM) as it approaches a sample. The results from e...

  14. Measurement of the absolute separation for atomic force microscopy measurements in the presence of adsorbed polymer

    OpenAIRE

    McKee, C. T.; Mosse, W. K. J.; Ducker, W. A.

    2006-01-01

    We demonstrate that the absolute separation between an atomic force microscope (AFM) tip and a solid substrate can be measured in the presence of an irreversibly adsorbed polymer film. The separation is obtained from the analysis of a scattered evanescent wave that is generated at the surface of the solid. By comparing our scattering measurements to conventional AFM measurements, we also show an example where a conventional AFM measurement gives the incorrect force-distance profile. We valida...

  15. Effects of Microscopic Three-body Forces in Asymmetric Nuclear Matter

    Institute of Scientific and Technical Information of China (English)

    2001-01-01

    The efiects of microscopic three-body forces on the equatioil of state(EOS)and the single particle properties of isospin asymmetric nuclear matter have been studied within Brueckner-Hartree-Fock framework~[1]The microscopic three-body force model constructed from meson exchange current approach in Ref.~[2] has been extended to isospin asymmetric nuclear matter

  16. Nanoscale Subsurface Imaging via Resonant Difference-Frequency Atomic Force Ultrasonic Microscopy

    Science.gov (United States)

    Cantrell, Sean A.; Cantrell, John H.; Lilehei, Peter T.

    2007-01-01

    A novel scanning probe microscope methodology has been developed that employs an ultrasonic wave launched from the bottom of a sample while the cantilever of an atomic force microscope, driven at a frequency differing from the ultrasonic frequency by the fundamental resonance frequency of the cantilever, engages the sample top surface. The nonlinear mixing of the oscillating cantilever and the ultrasonic wave in the region defined by the cantilever tip-sample surface interaction force generates difference-frequency oscillations at the cantilever fundamental resonance. The resonance-enhanced difference-frequency signals are used to create images of embedded nanoscale features.

  17. Nano-scale mechanical probing of supported lipid bilayers with atomic force microscopy

    OpenAIRE

    Das, Chinmay; Sheik, Khizar H.; Olmsted, Peter D.; Connell, Simon D.

    2010-01-01

    We present theory and experiments for the force-distance curve $F(z_0)$ of an atomic force microscope (AFM) tip (radius $R$) indenting a supported fluid bilayer (thickness $2d$). For realistic conditions the force is dominated by the area compressibility modulus $\\kappa_A$ of the bilayer, and, to an excellent approximation, given by $F= \\pi \\kappa_A R z_0^2/(2d-z_0)^2$. The experimental AFM force curves from coexisting liquid ordered and liquid disordered domains in 3-component lipid bilayers...

  18. Atomic Force Microscopy Based Cell Shape Index

    Science.gov (United States)

    Adia-Nimuwa, Usienemfon; Mujdat Tiryaki, Volkan; Hartz, Steven; Xie, Kan; Ayres, Virginia

    2013-03-01

    Stellation is a measure of cell physiology and pathology for several cell groups including neural, liver and pancreatic cells. In the present work, we compare the results of a conventional two-dimensional shape index study of both atomic force microscopy (AFM) and fluorescent microscopy images with the results obtained using a new three-dimensional AFM-based shape index similar to sphericity index. The stellation of astrocytes is investigated on nanofibrillar scaffolds composed of electrospun polyamide nanofibers that has demonstrated promise for central nervous system (CNS) repair. Recent work by our group has given us the ability to clearly segment the cells from nanofibrillar scaffolds in AFM images. The clear-featured AFM images indicated that the astrocyte processes were longer than previously identified at 24h. It was furthermore shown that cell spreading could vary significantly as a function of environmental parameters, and that AFM images could record these variations. The new three-dimensional AFM-based shape index incorporates the new information: longer stellate processes and cell spreading. The support of NSF PHY-095776 is acknowledged.

  19. Investigating bioconjugation by atomic force microscopy

    Science.gov (United States)

    2013-01-01

    Nanotechnological applications increasingly exploit the selectivity and processivity of biological molecules. Integration of biomolecules such as proteins or DNA into nano-systems typically requires their conjugation to surfaces, for example of carbon-nanotubes or fluorescent quantum dots. The bioconjugated nanostructures exploit the unique strengths of both their biological and nanoparticle components and are used in diverse, future oriented research areas ranging from nanoelectronics to biosensing and nanomedicine. Atomic force microscopy imaging provides valuable, direct insight for the evaluation of different conjugation approaches at the level of the individual molecules. Recent technical advances have enabled high speed imaging by AFM supporting time resolutions sufficient to follow conformational changes of intricately assembled nanostructures in solution. In addition, integration of AFM with different spectroscopic and imaging approaches provides an enhanced level of information on the investigated sample. Furthermore, the AFM itself can serve as an active tool for the assembly of nanostructures based on bioconjugation. AFM is hence a major workhorse in nanotechnology; it is a powerful tool for the structural investigation of bioconjugation and bioconjugation-induced effects as well as the simultaneous active assembly and analysis of bioconjugation-based nanostructures. PMID:23855448

  20. Introduction to Atomic Force Microscopy (AFM) in Biology.

    Science.gov (United States)

    Kreplak, Laurent

    2016-01-01

    The atomic force microscope (AFM) has the unique capability of imaging biological samples with molecular resolution in buffer solution over a wide range of time scales from milliseconds to hours. In addition to providing topographical images of surfaces with nanometer- to angstrom-scale resolution, forces between single molecules and mechanical properties of biological samples can be investigated from the nano-scale to the micro-scale. Importantly, the measurements are made in buffer solutions, allowing biological samples to "stay alive" within a physiological-like environment while temporal changes in structure are measured-e.g., before and after addition of chemical reagents. These qualities distinguish AFM from conventional imaging techniques of comparable resolution, e.g., electron microscopy (EM). This unit provides an introduction to AFM on biological systems and describes specific examples of AFM on proteins, cells, and tissues. The physical principles of the technique and methodological aspects of its practical use and applications are also described. © 2016 by John Wiley & Sons, Inc. PMID:27479503

  1. Sharing my fifteen years experiences in the research field of Atomic Force Microscopy (AFM

    Directory of Open Access Journals (Sweden)

    Guha T

    2014-03-01

    Full Text Available Atomic Force Microscope (AFM was developed by Binnig and his coworkers in the year 1986. He was awarded Nobel Prize in physics for this work in 1986 in sharing with Rohrer and Ruska. Rationale to develop AFM: Scanning Tunneling Microscope (STM, the precursor to AFM is efficient in imaging electrically conducting specimen at atomic resolution. The impetus for development of AFM came to Binnig’s mind because of relatively poor efficiency of STM to image electrically non-conducting biological samples. He wondered why the surfaces be always imaged with a current but not with a force. He thought if small forces of interactions between a probe tip atoms and specimen surface atoms could be detected and amplified then imaging of biological specimen would be possible at a very high resolution. AFM working Principle: AFM is a Scanning Probe Microscopy (SPM by which imaging is realized by interaction of a probe with sample surface without any beam (light, electron and lens system. The probe is attached to a soft and sensitive cantilever and either specimen is scanned by probe or specimen scans itself under a stationary probe. Probe’s spring constant must be small and the deflection must be measurable along with high resonance frequency. The most commonly associated force with AFM is called Vander Waals force. Three modes of working are contact mode, non contact mode and tapping mode. In contact zone, the probe tip attached with cantilever is held less than a few A˚ from the sample surface and the inter-atomic force between the atoms of probe tip and sample surface is repulsive. In non-contact zone, the probe tip is held at a distance of 100s of A˚ from the sample surface and the inter-atomic force here is long range Vander Waals interaction and is attractive in nature. AFM is also called Scanning Force Microscope because the force of interaction between probe tip atoms and surface atoms is amplified to generate a signal voltage which modulates video

  2. Submolecular Resolution Imaging of molecules by Atomic Force Microscopy:The influence of the Electrostatic Force

    NARCIS (Netherlands)

    van der Lit, J.; Cicco, F.; Hapala, P.; Jelinek, P.; Swart, Ingmar

    2016-01-01

    The forces governing the contrast in submolecular resolution imaging of molecules with atomic force microscopy (AFM) have recently become a topic of intense debate. Here, we show that the electrostatic force is essential to understand the contrast in atomically resolved AFM images of polar molecules

  3. In situ atomic force microscope imaging of supported lipid bilayers

    DEFF Research Database (Denmark)

    Kaasgaard, Thomas; Leidy, Chad; Ipsen, John Hjorth;

    2001-01-01

    In situ AFM images of phospholipase A/sub 2/ (PLA/sub 2/) hydrolysis of mica-supported one- and two-component lipid bilayers are presented. For one-component DPPC bilayers an enhanced enzymatic activity is observed towards preexisting defects in the bilayer. Phase separation is observed in two-co...

  4. Surface forces studied with colloidal probe atomic force microscopy

    NARCIS (Netherlands)

    Giesbers, M.

    2001-01-01

    Forces between surfaces are a determining factor for the performance of natural as well as synthetic colloidal systems, and play a crucial role in industrial production processes. Measuring these forces is a scientific and experimental challenge and over the years several techniques have been develo

  5. Cold atoms in microscopic traps from wires to chips

    CERN Document Server

    Cassettari, D

    2000-01-01

    Ioffe-Pritchard trap. In the latter we have achieved the trapping parameters required in the experiments with Bose-Einstein condensates with much reduced power consumption. In a second time we have replaced the free standing wires with an atom chip, which we have used to compress the atomic cloud in potentials with trap frequencies above 100 kHz and ground state sizes below 100 nm. Such potentials are especially interesting for quantum information proposals of performing quantum gate operations with controlled collisions between trapped atoms. Finally, by combining two wire guides we have experimentally realized an innovative kind of beam splitter for guided atoms. We have investigated the splitting potential generated by a Y-shaped wire which has one input, i.e. the central arm of the Y, and two outputs corresponding to the left and right arms of the Y. By tuning the current ratio in the two outputs we have observed atoms switching from left to right as well as symmetric splitting. This and other similar des...

  6. Nonlinear Dynamics of Cantilever-Sample Interactions in Atomic Force Microscopy

    Science.gov (United States)

    Cantrell, John H.; Cantrell, Sean A.

    2010-01-01

    The interaction of the cantilever tip of an atomic force microscope (AFM) with the sample surface is obtained by treating the cantilever and sample as independent systems coupled by a nonlinear force acting between the cantilever tip and a volume element of the sample surface. The volume element is subjected to a restoring force from the remainder of the sample that provides dynamical equilibrium for the combined systems. The model accounts for the positions on the cantilever of the cantilever tip, laser probe, and excitation force (if any) via a basis set of set of orthogonal functions that may be generalized to account for arbitrary cantilever shapes. The basis set is extended to include nonlinear cantilever modes. The model leads to a pair of coupled nonlinear differential equations that are solved analytically using a matrix iteration procedure. The effects of oscillatory excitation forces applied either to the cantilever or to the sample surface (or to both) are obtained from the solution set and applied to the to the assessment of phase and amplitude signals generated by various acoustic-atomic force microscope (A-AFM) modalities. The influence of bistable cantilever modes of on AFM signal generation is discussed. The effects on the cantilever-sample surface dynamics of subsurface features embedded in the sample that are perturbed by surface-generated oscillatory excitation forces and carried to the cantilever via wave propagation are accounted by the Bolef-Miller propagating wave model. Expressions pertaining to signal generation and image contrast in A-AFM are obtained and applied to amplitude modulation (intermittent contact) atomic force microscopy and resonant difference-frequency atomic force ultrasonic microscopy (RDF-AFUM). The influence of phase accumulation in A-AFM on image contrast is discussed, as is the effect of hard contact and maximum nonlinearity regimes of A-AFM operation.

  7. Dispersion forces II. Many-body effects, excited atoms, finite temperature and quantum friction

    Energy Technology Data Exchange (ETDEWEB)

    Buhmann, Stefan Yoshi [Imperial College London (United Kingdom). Quantum Optics and Laser Science

    2012-07-01

    Presents the unified theory of dispersion forces. Gives a thorough overview over recent results of dispersion forces. Deals with applied macroscopic quantum electrodynamics. Gives guidance to simulation of realistic material properties. In this book, a modern unified theory of dispersion forces on atoms and bodies is presented which covers a broad range of advanced aspects and scenarios. Macroscopic quantum electrodynamics is shown to provide a powerful framework for dispersion forces which allows for discussing general properties like their non-additivity and the relation between microscopic and macroscopic interactions. It is demonstrated how the general results can be used to obtain dispersion forces on atoms in the presence of bodies of various shapes and materials. Starting with a brief recapitulation of volume I, this volume II deals especially with bodies of irregular shapes, universal scaling laws, dynamical forces on excited atoms, enhanced forces in cavity quantum electrodynamics, non-equilibrium forces in thermal environments and quantum friction. The book gives both the specialist and those new to the field a thorough overview over recent results in the field. It provides a toolbox for studying dispersion forces in various contexts.

  8. Atomic force microscopy images of T4 bacteriophages on silicon substrates

    Energy Technology Data Exchange (ETDEWEB)

    Kolbe, W.F.; Ogletree, D.F.; Salmeron, M.B.

    1991-08-01

    A new atomic force microscope incorporating microfabricated cantilevers and employing laser beam deflection for force detection has been constructed and is being applied to studied of biological material. In this study, T4 bacteriophage virus particles were deposited from solution onto electronic grade flat silicon wafers and imaged in air with the microscope. Microliter droplets of the solution were deposited and either allowed to dry or removed with blotting paper. The images show both isolated viruses and aggregates of various sizes. The external structure as well as strands believed to be DNA streaming out of the virus could be observed. The construction of the microscope and its performance are also described. 19 refs., 4 figs.

  9. Atomic Force Microscopy as a Tool for Applied Virology and Microbiology

    Science.gov (United States)

    Zaitsev, Boris

    2003-12-01

    Atomic force microscope (AFM) can be successfully used for simple and fast solution of many applied biological problems. In this paper the survey of the results of the application of atomic force microscope SolverP47BIO (NT-MDT, Russia) in State Research Center of Virology and Biotechnology "Vector" is presented. The AFM has been used: - in applied virology for the counting of viral particles and examination of virus-cell interaction; - in microbiology for measurements and indication of bacterial spores and cells; - in biotechnology for control of biotechnological processes and evaluation of the distribution of particle dimension for viral and bacterial diagnostic assays. The main advantages of AFM in applied researches are simplicity of the processing of sample preparation and short time of the examination.

  10. Nanoscale Thermal Response in ZnO Varistors by Atomic Force Microscopy

    Institute of Scientific and Technical Information of China (English)

    ZHAO Kun-Yu; ZENG Hua-Rong; LI Guo-Rong; SONG Hong-Zhang; CHENG Li-Hong; HUI Sen-Xing; YIN Qing-Rui

    2009-01-01

    We report the application of customer-built scanning thermal microscopy (SThM) based on a commercial atomic force microscope to investigate local thermal inhomogeneity of ZnO varistors.The so-called 3ω method, generally used for measuring macroscale thermal conductivity, is set up and integrated with an atomic force microscope to probe the nanoseale therma J property.Remarkably, thermal contrasts of ZnO varistors are firstly imaged by the SThM, indicating the uniform distribution of spinel phases at triple points.The frequency-dependent thermal signal of ZnO varistors is also studied to present quantitative evaluation of local thermal conductivity of the sample.

  11. Silicon Carbide Epitaxial Films Studied by Atomic Force Microscopy

    Science.gov (United States)

    1996-01-01

    Silicon carbide (SiC) holds great potential as an electronic material because of its wide band gap energy, high breakdown electric field, thermal stability, and resistance to radiation damage. Possible aerospace applications of high-temperature, high-power, or high-radiation SiC electronic devices include sensors, control electronics, and power electronics that can operate at temperatures up to 600 C and beyond. Commercially available SiC devices now include blue light-emitting diodes (LED's) and high-voltage diodes for operation up to 350 C, with other devices under development. At present, morphological defects in epitaxially grown SiC films limit their use in device applications. Research geared toward reducing the number of structural inhomogeneities can benefit from an understanding of the type and nature of problems that cause defects. The Atomic Force Microscope (AFM) has proven to be a useful tool in characterizing defects present on the surface of SiC epitaxial films. The in-house High-Temperature Integrated Electronics and Sensors (HTIES) Program at the NASA Lewis Research Center not only extended the dopant concentration range achievable in epitaxial SiC films, but it reduced the concentration of some types of defects. Advanced structural characterization using the AFM was warranted to identify the type and structure of the remaining film defects and morphological inhomogeneities. The AFM can give quantitative information on surface topography down to molecular scales. Acquired, in part, in support of the Advanced High Temperature Engine Materials Technology Program (HITEMP), the AFM had been used previously to detect partial fiber debonding in composite material cross sections. Atomic force microscopy examination of epitaxial SiC film surfaces revealed molecular-scale details of some unwanted surface features. Growth pits propagating from defects in the substrate, and hillocks due, presumably, to existing screw dislocations in the substrates, were

  12. Phase contrast and operation regimes in multifrequency atomic force microscopy

    Energy Technology Data Exchange (ETDEWEB)

    Santos, Sergio [Departament de Disseny i Programació de Sistemes Electrònics, UPC—Universitat Politècnica de Catalunya Av. Bases, 61, 08242 Manresa (Barcelona) (Spain)

    2014-04-07

    In amplitude modulation atomic force microscopy the attractive and the repulsive force regimes induce phase shifts above and below 90°, respectively. In the more recent multifrequency approach, however, multiple operation regimes have been reported and the theory should be revisited. Here, a theory of phase contrast in multifrequency atomic force microscopy is developed and discussed in terms of energy transfer between modes, energy dissipation and the kinetic energy and energy transfer associated with externally driven harmonics. The single frequency virial that controls the phase shift might undergo transitions in sign while the average force (modal virial) remains positive (negative)

  13. Raman-atomic force microscopy of the ommatidial surfaces of Dipteran compound eyes

    Science.gov (United States)

    Anderson, Mark S.; Gaimari, Stephen D.

    2003-01-01

    The ommatidial lens surfaces of the compound eyes in several species of files (Insecta: Diptera) and a related order (Mecoptera) were analyzed using a recently developed Raman-atomic force microscope. We demonstrate in this work that the atomic force microscope (AFM) is a potentially useful instrument for gathering phylogenetic data and that the newly developed Raman-AFM may extend this application by revealing nanometer-scale surface chemistry. This is the first demonstration of apertureless near-field Raman spectroscopy on an intact biological surface. For Chrysopilus testaceipes Bigot (Rhagionidae), this reveals unique cerebral cortex-like surface ridges with periodic variation in height and surface chemistry. Most other Brachyceran flies, and the "Nematoceran" Sylvicola fenestralis (Scopoli) (Anisopodidae), displayed the same morphology, while other taxa displayed various other characteristics, such as a nodule-like (Tipula (Triplicitipula) sp. (Tipulidae)) or coalescing nodule-like (Tabanus punctifer Osten Sacken (Tabanidae)) morphology, a smooth morphology with distinct pits and grooves (Dilophus orbatus (Say) (Bibionidae)), or an entirely smooth surface (Bittacus chlorostigma MacLachlan (Mecoptera: Bittacidae)). The variation in submicrometer structure and surface chemistry provides a new information source of potential phylogenetic importance, suggesting the Raman-atomic force microscope could provide a new tool useful to systematic and evolutionary inquiry.

  14. Depletion interaction measured by colloidal probe atomic force microscopy

    NARCIS (Netherlands)

    Wijting, W.K.; Knoben, W.; Besseling, N.A.M.; Leermakers, F.A.M.; Cohen Stuart, M.A.

    2004-01-01

    We investigated the depletion interaction between stearylated silica surfaces in cyclohexane in the presence of dissolved polydimethylsiloxane by means of colloidal probe atomic force microscopy. We found that the range of the depletion interaction decreases with increasing concentration. Furthermor

  15. Analysis of Atomic Force Curve Data for Mapping of Surface Properties in Water

    Science.gov (United States)

    Sirghi, Lucel; Nakagiri, Nobuyuki; Sugimura, Hiroyuki; Takai, Osamu

    2001-03-01

    This paper presents an analysis of atomic force versus distance curves for a silicon nitride probe and a silicon sample immersed in water. A custom-built atomic force microscope (AFM) was adapted for working in water by building a water cell from a liquid drop caught between a glass lamella fixed on the top of the cantilever base and the sample surface. An algorithm for processing of force curve data for long- and short-range forces is described. The force curve data taken for a sample consisting of a silicon wafer Si(111) patterned with V-shaped grooves and a silicon nitride cantilever in water were digitally acquired and automatically processed for mapping of surface properties. A weak repulsive double layer force with no relevant dependence on sample topography was observed on the force curves taken during approach movement of the cantilever. On the other hand, the attractive hydration force showed a strong dependence on the sample topography. Large hydration force values were noticed on the inclined faces of the V-shaped grooves while small hydration force values were noticed outside the grooves. The result was explained by the dependence of the tip curvature radius at the contact region on the tilt of the sample surface.

  16. In-trap fluorescence detection of atoms in a microscopic dipole trap

    CERN Document Server

    Hilliard, A J; Sompet, P; Carpentier, A V; Andersen, M F

    2015-01-01

    We investigate fluorescence detection using a standing wave of blue-detuned light of one or more atoms held in a deep, microscopic dipole trap. The blue-detuned standing wave realizes a Sisyphus laser cooling mechanism so that an atom can scatter many photons while remaining trapped. When imaging more than one atom, the blue detuning limits loss due to inelastic light-assisted collisions. Using this standing wave probe beam, we demonstrate that we can count from one to the order of 100 atoms in the microtrap with sub-poissonian precision.

  17. Submolecular Resolution Imaging of Molecules by Atomic Force Microscopy: The Influence of the Electrostatic Force

    Science.gov (United States)

    van der Lit, Joost; Di Cicco, Francesca; Hapala, Prokop; Jelinek, Pavel; Swart, Ingmar

    2016-03-01

    The forces governing the contrast in submolecular resolution imaging of molecules with atomic force microscopy (AFM) have recently become a topic of intense debate. Here, we show that the electrostatic force is essential to understand the contrast in atomically resolved AFM images of polar molecules. Specifically, we image strongly polarized molecules with negatively and positively charged tips. A contrast inversion is observed above the polar groups. By taking into account the electrostatic forces between tip and molecule, the observed contrast differences can be reproduced using a molecular mechanics model. In addition, we analyze the height dependence of the various force components contributing to the high-resolution AFM contrast.

  18. The unfolding of native laminin investigated by atomic force microscopy

    Science.gov (United States)

    Nemes, Cs.; Ramsden, J. J.; Rozlosnik, N.

    2002-10-01

    Atomic force microscopy has been used to directly measure the forces required to unfold individual domains of the extracellular matrix protein laminin. The approach-retraction cycles display a characteristic saw-tooth motif. Tooth heights and separations were used to establish a statistical relation between domain unfolding force and domain extension. The extensible domains of laminin require an unfolding force intermediate between previously established values for α-helical and β-sheet domains in other proteins. The relationship between unfolding force and extension for a given domain is not smooth; discrete steps are observed, interpreted as originating from the modularity of the protein structure.

  19. Invited Article: Autonomous assembly of atomically perfect nanostructures using a scanning tunneling microscope

    Energy Technology Data Exchange (ETDEWEB)

    Celotta, Robert J., E-mail: robert.celotta@nist.gov, E-mail: joseph.stroscio@nist.gov; Hess, Frank M.; Rutter, Gregory M.; Stroscio, Joseph A., E-mail: robert.celotta@nist.gov, E-mail: joseph.stroscio@nist.gov [Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States); Balakirsky, Stephen B. [Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States); Georgia Tech Research Institute, Atlanta, Georgia 30332 (United States); Fein, Aaron P. [Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States)

    2014-12-15

    A major goal of nanotechnology is to develop the capability to arrange matter at will by placing individual atoms at desired locations in a predetermined configuration to build a nanostructure with specific properties or function. The scanning tunneling microscope has demonstrated the ability to arrange the basic building blocks of matter, single atoms, in two-dimensional configurations. An array of various nanostructures has been assembled, which display the quantum mechanics of quantum confined geometries. The level of human interaction needed to physically locate the atom and bring it to the desired location limits this atom assembly technology. Here we report the use of autonomous atom assembly via path planning technology; this allows atomically perfect nanostructures to be assembled without the need for human intervention, resulting in precise constructions in shorter times. We demonstrate autonomous assembly by assembling various quantum confinement geometries using atoms and molecules and describe the benefits of this approach.

  20. Invited Article: Autonomous assembly of atomically perfect nanostructures using a scanning tunneling microscope.

    Science.gov (United States)

    Celotta, Robert J; Balakirsky, Stephen B; Fein, Aaron P; Hess, Frank M; Rutter, Gregory M; Stroscio, Joseph A

    2014-12-01

    A major goal of nanotechnology is to develop the capability to arrange matter at will by placing individual atoms at desired locations in a predetermined configuration to build a nanostructure with specific properties or function. The scanning tunneling microscope has demonstrated the ability to arrange the basic building blocks of matter, single atoms, in two-dimensional configurations. An array of various nanostructures has been assembled, which display the quantum mechanics of quantum confined geometries. The level of human interaction needed to physically locate the atom and bring it to the desired location limits this atom assembly technology. Here we report the use of autonomous atom assembly via path planning technology; this allows atomically perfect nanostructures to be assembled without the need for human intervention, resulting in precise constructions in shorter times. We demonstrate autonomous assembly by assembling various quantum confinement geometries using atoms and molecules and describe the benefits of this approach.

  1. Microscopic mean field approximation and beyond with the Gogny force

    International Nuclear Information System (INIS)

    Fully consistent axially-symmetric-deformed quasiparticle random phase approximation (QRPA) calculations have been performed with the D1S Gogny force. A brief review on the main results obtained in this approach is presented. After a reminder on the method and on the first results concerning giant resonances in deformed Mg and Si isotopes, the multipole responses up to octupole in the deformed and heavy nucleus 238U are discussed. In order to analyse soft dipole modes in exotic nuclei, the dipole responses have been studied in Ne isotopes and in N=16 isotopes, for which results are presented. In these nuclei, the QRPA results on the low lying 2+ states are compared to the 5-Dimensional Collective Hamiltonian (5DCH) ones. Results on dipole mode are in good agreement with experimental data. For spherical nuclei, the QRPA formalism completes the 5DCH predictions including the same effective interaction

  2. Electrical characterization of grain boundaries of CZTS thin films using conductive atomic force microscopy techniques

    Energy Technology Data Exchange (ETDEWEB)

    Muhunthan, N.; Singh, Om Pal [Compound Semiconductor Solar Cell, Physics of Energy Harvesting Division, New Delhi 110012 (India); Toutam, Vijaykumar, E-mail: toutamvk@nplindia.org [Quantum Phenomena and Applications Division, CSIR-National Physical Laboratory, Dr. K.S. Krishnan Marg, New Delhi 110012 (India); Singh, V.N., E-mail: singhvn@nplindia.org [Compound Semiconductor Solar Cell, Physics of Energy Harvesting Division, New Delhi 110012 (India)

    2015-10-15

    Graphical abstract: Experimental setup for conducting AFM (C-AFM). - Highlights: • Cu{sub 2}ZnSnS{sub 4} (CZTS) thin film was grown by reactive co-sputtering. • The electronic properties were probed using conducting atomic force microscope, scanning Kelvin probe microscopy and scanning capacitance microscopy. • C-AFM current flow mainly through grain boundaries rather than grain interiors. • SKPM indicated higher potential along the GBs compared to grain interiors. • The SCM explains that charge separation takes place at the interface of grain and grain boundary. - Abstract: Electrical characterization of grain boundaries (GB) of Cu-deficient CZTS (Copper Zinc Tin Sulfide) thin films was done using atomic force microscopic (AFM) techniques like Conductive atomic force microscopy (CAFM), Kelvin probe force microscopy (KPFM) and scanning capacitance microscopy (SCM). Absorbance spectroscopy was done for optical band gap calculations and Raman, XRD and EDS for structural and compositional characterization. Hall measurements were done for estimation of carrier mobility. CAFM and KPFM measurements showed that the currents flow mainly through grain boundaries (GB) rather than grain interiors. SCM results showed that charge separation mainly occurs at the interface of grain and grain boundaries and not all along the grain boundaries.

  3. Enhanced quality factors and force sensitivity by attaching magnetic beads to cantilevers for atomic force microscopy in liquid

    CERN Document Server

    Hoof, Sebastian; Hoogenboom, Bart W

    2012-01-01

    Dynamic-mode atomic force microscopy (AFM) in liquid remains complicated due to the strong viscous damping of the cantilever resonance. Here we show that a high-quality resonance (Q>20) can be achieved in aqueous solution by attaching a microgram-bead at the end of the nanogram-cantilever. The resulting increase in cantilever mass causes the resonance frequency to drop significantly. However, the force sensitivity --- as expressed via the minimum detectable force gradient --- is hardly affected, because of the enhanced quality factor. Via the enhancement of the quality factor, the attached bead also reduces the relative importance of noise in the deflection detector. It can thus yield an improved signal-to-noise ratio when this detector noise is significant. We describe and analyze these effects for a set-up which includes magnetic actuation of the cantilevers and which can be easily implemented in any AFM system that is compatible with an inverted optical microscope.

  4. Nano Scale Mechanical Analysis of Biomaterials Using Atomic Force Microscopy

    Science.gov (United States)

    Dutta, Diganta

    The atomic force microscope (AFM) is a probe-based microscope that uses nanoscale and structural imaging where high resolution is desired. AFM has also been used in mechanical, electrical, and thermal engineering applications. This unique technique provides vital local material properties like the modulus of elasticity, hardness, surface potential, Hamaker constant, and the surface charge density from force versus displacement curve. Therefore, AFM was used to measure both the diameter and mechanical properties of the collagen nanostraws in human costal cartilage. Human costal cartilage forms a bridge between the sternum and bony ribs. The chest wall of some humans is deformed due to defective costal cartilage. However, costal cartilage is less studied compared to load bearing cartilage. Results show that there is a difference between chemical fixation and non-chemical fixation treatments. Our findings imply that the patients' chest wall is mechanically weak and protein deposition is abnormal. This may impact the nanostraws' ability to facilitate fluid flow between the ribs and the sternum. At present, AFM is the only tool for imaging cells' ultra-structure at the nanometer scale because cells are not homogeneous. The first layer of the cell is called the cell membrane, and the layer under it is made of the cytoskeleton. Cancerous cells are different from normal cells in term of cell growth, mechanical properties, and ultra-structure. Here, force is measured with very high sensitivity and this is accomplished with highly sensitive probes such as a nano-probe. We performed experiments to determine ultra-structural differences that emerge when such cancerous cells are subject to treatments such as with drugs and electric pulses. Jurkat cells are cancerous cells. These cells were pulsed at different conditions. Pulsed and non-pulsed Jurkat cell ultra-structures were investigated at the nano meter scale using AFM. Jurkat cell mechanical properties were measured under

  5. Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy

    OpenAIRE

    Joachim Welker; Esther Illek; Giessibl, Franz J.

    2012-01-01

    In frequency-modulation atomic force microscopy the direct observable is the frequency shift of an oscillating cantilever in a force field. This frequency shift is not a direct measure of the actual force, and thus, to obtain the force, deconvolution methods are necessary. Two prominent methods proposed by Sader and Jarvis (Sader–Jarvis method) and Giessibl (matrix method) are investigated with respect to the deconvolution quality. Both methods show a nontrivial dependence of the deconv...

  6. Immobilization of different biomolecules by atomic force microscopy

    Directory of Open Access Journals (Sweden)

    Hölzel Ralph

    2010-05-01

    Full Text Available Abstract Background Micrometer resolution placement and immobilization of probe molecules is an important step in the preparation of biochips and a wide range of lab-on-chip systems. Most known methods for such a deposition of several different substances are costly and only suitable for a limited number of probes. In this article we present a flexible procedure for simultaneous spatially controlled immobilization of functional biomolecules by molecular ink lithography. Results For the bottom-up fabrication of surface bound nanostructures a universal method is presented that allows the immobilization of different types of biomolecules with micrometer resolution. A supporting surface is biotinylated and streptavidin molecules are deposited with an AFM (atomic force microscope tip at distinct positions. Subsequent incubation with a biotinylated molecule species leads to binding only at these positions. After washing streptavidin is deposited a second time with the same AFM tip and then a second biotinylated molecule species is coupled by incubation. This procedure can be repeated several times. Here we show how to immobilize different types of biomolecules in an arbitrary arrangement whereas most common methods can deposit only one type of molecules. The presented method works on transparent as well as on opaque substrates. The spatial resolution is better than 400 nm and is limited only by the AFM's positional accuracy after repeated z-cycles since all steps are performed in situ without moving the supporting surface. The principle is demonstrated by hybridization to different immobilized DNA oligomers and was validated by fluorescence microscopy. Conclusions The immobilization of different types of biomolecules in high-density microarrays is a challenging task for biotechnology. The method presented here not only allows for the deposition of DNA at submicrometer resolution but also for proteins and other molecules of biological relevance that

  7. Autopilot for frequency-modulation atomic force microscopy

    Energy Technology Data Exchange (ETDEWEB)

    Kuchuk, Kfir; Schlesinger, Itai; Sivan, Uri, E-mail: phsivan@tx.technion.ac.il [Department of Physics and the Russell Berrie Nanotechnology Institute, Technion - Israel Institute of Technology, Haifa 32000 (Israel)

    2015-10-15

    One of the most challenging aspects of operating an atomic force microscope (AFM) is finding optimal feedback parameters. This statement applies particularly to frequency-modulation AFM (FM-AFM), which utilizes three feedback loops to control the cantilever excitation amplitude, cantilever excitation frequency, and z-piezo extension. These loops are regulated by a set of feedback parameters, tuned by the user to optimize stability, sensitivity, and noise in the imaging process. Optimization of these parameters is difficult due to the coupling between the frequency and z-piezo feedback loops by the non-linear tip-sample interaction. Four proportional-integral (PI) parameters and two lock-in parameters regulating these loops require simultaneous optimization in the presence of a varying unknown tip-sample coupling. Presently, this optimization is done manually in a tedious process of trial and error. Here, we report on the development and implementation of an algorithm that computes the control parameters automatically. The algorithm reads the unperturbed cantilever resonance frequency, its quality factor, and the z-piezo driving signal power spectral density. It analyzes the poles and zeros of the total closed loop transfer function, extracts the unknown tip-sample transfer function, and finds four PI parameters and two lock-in parameters for the frequency and z-piezo control loops that optimize the bandwidth and step response of the total system. Implementation of the algorithm in a home-built AFM shows that the calculated parameters are consistently excellent and rarely require further tweaking by the user. The new algorithm saves the precious time of experienced users, facilitates utilization of FM-AFM by casual users, and removes the main hurdle on the way to fully automated FM-AFM.

  8. Autopilot for frequency-modulation atomic force microscopy

    Science.gov (United States)

    Kuchuk, Kfir; Schlesinger, Itai; Sivan, Uri

    2015-10-01

    One of the most challenging aspects of operating an atomic force microscope (AFM) is finding optimal feedback parameters. This statement applies particularly to frequency-modulation AFM (FM-AFM), which utilizes three feedback loops to control the cantilever excitation amplitude, cantilever excitation frequency, and z-piezo extension. These loops are regulated by a set of feedback parameters, tuned by the user to optimize stability, sensitivity, and noise in the imaging process. Optimization of these parameters is difficult due to the coupling between the frequency and z-piezo feedback loops by the non-linear tip-sample interaction. Four proportional-integral (PI) parameters and two lock-in parameters regulating these loops require simultaneous optimization in the presence of a varying unknown tip-sample coupling. Presently, this optimization is done manually in a tedious process of trial and error. Here, we report on the development and implementation of an algorithm that computes the control parameters automatically. The algorithm reads the unperturbed cantilever resonance frequency, its quality factor, and the z-piezo driving signal power spectral density. It analyzes the poles and zeros of the total closed loop transfer function, extracts the unknown tip-sample transfer function, and finds four PI parameters and two lock-in parameters for the frequency and z-piezo control loops that optimize the bandwidth and step response of the total system. Implementation of the algorithm in a home-built AFM shows that the calculated parameters are consistently excellent and rarely require further tweaking by the user. The new algorithm saves the precious time of experienced users, facilitates utilization of FM-AFM by casual users, and removes the main hurdle on the way to fully automated FM-AFM.

  9. Microrheology of cells with magnetic force modulation atomic force microscopy.

    Science.gov (United States)

    Rebêlo, L M; de Sousa, J S; Mendes Filho, J; Schäpe, J; Doschke, H; Radmacher, M

    2014-04-01

    We propose a magnetic force modulation method to measure the stiffness and viscosity of living cells using a modified AFM apparatus. An oscillating magnetic field makes a magnetic cantilever oscillate in contact with the sample, producing a small AC indentation. By comparing the amplitude of the free cantilever motion (A0) with the motion of the cantilever in contact with the sample (A1), we determine the sample stiffness and viscosity. To test the method, the frequency-dependent stiffness of 3T3 fibroblasts was determined as a power law k(s)(f) = α + β(f/f¯)(γ) (α = 7.6 × 10(-4) N m(-1), β = 1.0 × 10(-4) N m(-1), f¯ = 1 Hz, γ = 0.6), where the coefficient γ = 0.6 is in good agreement with rheological data of actin solutions with concentrations similar to those in cells. The method also allows estimation of the internal friction of the cells. In particular we found an average damping coefficient of 75.1 μN s m(-1) for indentation depths ranging between 1.0 μm and 2.0 μm. PMID:24651941

  10. Imaging and modification of polymers by scanning tunneling and atomic force microscopy

    Science.gov (United States)

    Albrecht, T. R.; Dovek, M. M.; Lang, C. A.; Grütter, P.; Quate, C. F.; Kuan, S. W. J.; Frank, C. W.; Pease, R. F. W.

    1988-08-01

    Direct imaging of ultrathin organic films on solid surfaces is important for a variety of reasons; in particular, the use of such films as ultrathin resists for nanometer scale fabrication and information recording requires that we understand their microstrucure. We have used the Langmuir-Blodgett technique to prepare monolayer and submonolayer films of poly(octadecylacrylate) (PODA) and poly(methylmethacrylate) (PMMA) on graphite substrates. Atomic scale images obtained with the scanning tunneling microscope (STM) and the atomic force microscope of the PODA films showed a variety of structures, including isolated narrow fibrils, parallel groups of fibrils, and an ordered structure consistent with the side chain crystallization expected with that material. The fibrils observed are interpreted as individual polymer chains or small bundles of parallel chains. Images of the PMMA samples show no ordered regions. By applying voltage pulses on the STM tip, we were able to locally modify and apparently cut through the PODA fibrils.

  11. Visible Light Emission from Atomic Scale Patterns Fabricated by the Scanning Tunneling Microscope

    DEFF Research Database (Denmark)

    Thirstrup, C.; Sakurai, M.; Stokbro, Kurt;

    1999-01-01

    Scanning tunneling microscope (STM) induced light emission from artificial atomic scale structures comprising silicon dangling bonds on hydrogen-terminated Si(001) surfaces has been mapped spatially and analyzed spectroscopically in the visible spectral range. The light emission is based on a novel...

  12. Morfología Superficial de Almidones Termoplásticos Agrio de Yuca y Nativo de Papa por Microscopía Óptica y de Fuerza Atómica Surface Morphology of Sour Cassava and Native Potato Thermoplastic Starches by Optical and Atomic Force Microscopy

    Directory of Open Access Journals (Sweden)

    Harold A Acosta

    2006-01-01

    Full Text Available Se ha evaluado la morfología superficial de almidones termoplásticos (TPS obtenidos de almidones agrio de yuca y nativo de papa, extruidos con tornillo simple, usando microscopía óptica de alta resolución (OM y de fuerza atómica (AFM. Muestras de almidones agrio de yuca y nativo de papa más glicerina, se procesaron a 120 ºC y 50 rpm, dando extruidos que se cortaron en láminas delgadas, que se observaron por OM y AFM (modo contacto intermitente. El almidón nativo de papa mostró grandes gránulos ovoides y el almidón agrio de yuca reveló el ataque enzimático debido a la fermentación natural. Los TPS mostraron superficies lisas y rugosas dependiendo de la forma y el tamaño del gránulo, de la fermentación natural y del contenido de plastificante. Los TPS nativo de papa exhibieron pocas superficies lisas por OM y alta rugosidad por AFM; lo contrario se presentó con el TPS agrio de yuca, debido a su fermentación natural previa. Estos resultados contribuyen a predecir y entender las propiedades microestructurales, mecánicas y texturales de los almidones termoplásticos.An evaluation was made of the surface morphology of thermoplastic starches (TPS from sour cassava and native potato, extruded with a single-screw extruder, using high-resolution optical microscopy (OM and atomic force microscopy (AFM. Samples of sour cassava starch and native potato starch and glycerine, were processed at 120(0C and 50 rpm, producing extrudates which were cut into thin films for observation by OM and AFM (intermittent contact mode. Native potato starch showed large ovoid granules, while sour cassava starch revealed enzyme attack due to natural fermentation. The TPS had smooth and rough surfaces, depending upon granule size and shape, starch fermentation, and plasticizer content. Native potato TPS presented few smooth surfaces by OM and high roughness by AFM. The opposite was observed with sour cassava TPS, which had experienced some previous natural

  13. Theoretical Models for Surface Forces and Adhesion and Their Measurement Using Atomic Force Microscopy

    Directory of Open Access Journals (Sweden)

    Osvaldo N. Oliveira

    2012-10-01

    Full Text Available The increasing importance of studies on soft matter and their impact on new technologies, including those associated with nanotechnology, has brought intermolecular and surface forces to the forefront of physics and materials science, for these are the prevailing forces in micro and nanosystems. With experimental methods such as the atomic force spectroscopy (AFS, it is now possible to measure these forces accurately, in addition to providing information on local material properties such as elasticity, hardness and adhesion. This review provides the theoretical and experimental background of afs, adhesion forces, intermolecular interactions and surface forces in air, vacuum and in solution.

  14. Analytical Model of the Nonlinear Dynamics of Cantilever Tip-Sample Surface Interactions for Various Acoustic-Atomic Force Microscopies

    Science.gov (United States)

    Cantrell, John H., Jr.; Cantrell, Sean A.

    2008-01-01

    A comprehensive analytical model of the interaction of the cantilever tip of the atomic force microscope (AFM) with the sample surface is developed that accounts for the nonlinearity of the tip-surface interaction force. The interaction is modeled as a nonlinear spring coupled at opposite ends to linear springs representing cantilever and sample surface oscillators. The model leads to a pair of coupled nonlinear differential equations that are solved analytically using a standard iteration procedure. Solutions are obtained for the phase and amplitude signals generated by various acoustic-atomic force microscope (A-AFM) techniques including force modulation microscopy, atomic force acoustic microscopy, ultrasonic force microscopy, heterodyne force microscopy, resonant difference-frequency atomic force ultrasonic microscopy (RDF-AFUM), and the commonly used intermittent contact mode (TappingMode) generally available on AFMs. The solutions are used to obtain a quantitative measure of image contrast resulting from variations in the Young modulus of the sample for the amplitude and phase images generated by the A-AFM techniques. Application of the model to RDF-AFUM and intermittent soft contact phase images of LaRC-cp2 polyimide polymer is discussed. The model predicts variations in the Young modulus of the material of 24 percent from the RDF-AFUM image and 18 percent from the intermittent soft contact image. Both predictions are in good agreement with the literature value of 21 percent obtained from independent, macroscopic measurements of sheet polymer material.

  15. The Development of the High-Resolution Transmission Electron Microscope (HRTEM) Combined with AFM for Simultaneous Observation of Structure and Force of the Nanocontact

    Science.gov (United States)

    Shibata, Sakiko; Tanishiro, Yasumasa; Kondo, Yukihito; Minoda, Hiroki; Takayanagi, Kunio

    2004-03-01

    A high-resolution transmission electron microscope combined with an atomic force microscope (HRTEM-AFM) has been developed. It enables us to observe mechanical force and atomic structure of nanowires formed at the nanocontact simultaneously. And the self-sensing piezoresistive cantilever is used as an AFM probe in the HRTEM-AFM. It has high spatial resolution of 0.2nm and high force sensitivity of sub-nN. The HRTEM has also ability to work on ultra high vacuum(UHV) which is necessary to keep the nanocontact clean. The present system could never be developed without total redesigning of the goniometer stage of UHV-TEM which operates at 10-8 Pa.

  16. Imaging material properties of biological samples with a Force Feedback Microscope

    CERN Document Server

    Costa, Luca; Newman, Emily; Zubieta, Chloe; Chevrier, Joel; Comin, Fabio

    2013-01-01

    Mechanical properties of biological samples have been imaged with a force feedback microscope. The force, force gradient and the dissipation are simultaneously measured quantitatively from solely the knowledge of the spring constant. The results are preliminary but demonstrate that the method can be used to measure material properties, it is robust and produce quantitative high force resolution measurements of interaction characteristics. The small stiffness and oscillation of the cantilever results in an vibrational energy much smaller than the thermal energy, reducing the interaction to a minimum. Because the lever is over-damped, the excitation frequency can be chosen arbitrarily.

  17. Design and construction of a heat stage for investigations of samples by atomic force microscopy above ambient temperatures

    DEFF Research Database (Denmark)

    Bækmark, Thomas Rosleff; Bjørnholm, Thomas; Mouritsen, Ole G.

    1997-01-01

    The construction from simple and cheap commercially available parts of a miniature heat stage for the direct heating of samples studied with a commercially available optical-lever-detection atomic force microscope is reported. We demonstrate that by using this heat stage, atomic resolution can be...... be obtained on highly oriented pyrolytic graphite at 52 °C. The heat stage is of potential use for the investigation of biological material at physiological temperatures. ©1997 American Institute of Physics....

  18. Nanoscale mechanical probing of supported lipid bilayers with atomic force microscopy.

    Science.gov (United States)

    Das, Chinmay; Sheikh, Khizar H; Olmsted, Peter D; Connell, Simon D

    2010-10-01

    We present theory and experiments for the force-distance curve F(z(0)) of an atomic force microscope (AFM) tip (radius R) indenting a supported fluid bilayer (thickness 2d). For realistic conditions the force is dominated by the area compressibility modulus κ(A) of the bilayer and, to an excellent approximation, given by F=πκ(A)Rz(0)(2)/(2d-z(0))(2). The experimental AFM force curves from coexisting liquid ordered and liquid disordered domains in three-component lipid bilayers are well described by our model, which provides κ(A) in agreement with literature values. The liquid ordered phase has a yieldlike response that we model as due to the breaking of hydrogen bonds. PMID:21230326

  19. Nano-scale mechanical probing of supported lipid bilayers with atomic force microscopy

    CERN Document Server

    Das, Chinmay; Olmsted, Peter D; Connell, Simon D

    2010-01-01

    We present theory and experiments for the force-distance curve $F(z_0)$ of an atomic force microscope (AFM) tip (radius $R$) indenting a supported fluid bilayer (thickness $2d$). For realistic conditions the force is dominated by the area compressibility modulus $\\kappa_A$ of the bilayer, and, to an excellent approximation, given by $F= \\pi \\kappa_A R z_0^2/(2d-z_0)^2$. The experimental AFM force curves from coexisting liquid ordered and liquid disordered domains in 3-component lipid bilayers are well-described by our model, and provides $\\kappa_A$ in agreement with literature values. The liquid ordered phase has a yield like response that we model by hydrogen bond breaking.

  20. Microscopic Three-Body Force Effect on Nucleon-Nucleon Cross Sections in Symmetric Nuclear Matter

    Institute of Scientific and Technical Information of China (English)

    ZHANG Hong-Fei; ZUO Wei; Lombardo Umberto; LI Zeng-Hua; LI Jun-Qing

    2008-01-01

    We provide a microscopic calculation of neutron-proton and proton-proton cross sections in symmetric nuclear matter at various densities, using the Brueckner-Hartree-Fock approximation scheme with the Argonne V14 potential including the contribution of microscopic three-body force. We investigate separately the effects of three-body force on the effective mass and on the scattering amplitude. In the present calculation, the rearrangement contribution of three-body force is considered, which will reduce the neutron and proton effective mass, and depress the amplitude of cross section. The effect of three body force is shown to be repulsive, especially in high densities and large momenta, which will suppress the cross section markedly.

  1. Adsorption Geometry Determination of Single Molecules by Atomic Force Microscopy

    OpenAIRE

    Schuler, Bruno; Liu, Wei; Tkatchenko, Alexandre; Moll, Nikolaj; Meyer, Gerhard; Mistry, Anish; Fox, David; GROSS, Leo

    2013-01-01

    We measured the adsorption geometry of single molecules with intramolecular resolution using noncontact atomic force microscopy with functionalized tips. The lateral adsorption position was determined with atomic resolution, adsorption height differences with a precision of 3 pm, and tilts of the molecular plane within 0.2 degrees. The method was applied to five pi-conjugated molecules, including three molecules from the olympicene family, adsorbed on Cu(111). For the olympicenes, we found th...

  2. Nonequilibrium Atom-Dielectric Forces Mediated by a Quantum Field

    OpenAIRE

    Behunin, Ryan Orson; Hu, Bei-Lok

    2011-01-01

    In this paper we give a first principles microphysics derivation of the nonequilibrium forces between an atom, treated as a three dimensional harmonic oscillator, and a bulk dielectric medium modeled as a continuous lattice of oscillators coupled to a reservoir. We assume no direct interaction between the atom and the medium but there exist mutual influences transmitted via a common electromagnetic field. By employing concepts and techniques of open quantum systems we introduce coarse-grainin...

  3. Intermittent contact atomic force microscopy in electrochemical environment

    Energy Technology Data Exchange (ETDEWEB)

    Haering, P.; Koetz, R. [Paul Scherrer Inst. (PSI), Villigen (Switzerland); Siegenthaler, H. [Bern Univ., Bern (Switzerland)

    1997-06-01

    In situ measurements with Atomic Force Microscopy may cause surface modifications due to the tip-surface interactions. As an alternative and less destructive method, Intermittent Contact Atomic Force Microscopy (ICAFM) has been tested in an electrolytic environment. In the ICAFM mode the tip is not constantly in contact with the surface under investigation but is tapping onto the surface with a certain frequency. A commercial Park Scientific Instruments Microscopy has been modified to enable in situ experiment with ICAFM. It was possible to image iridium oxide films with ICAFM in the electrolytic environment without any noticeable surface modifications. (author) 3 figs., 4 refs.

  4. Efficient loading of a single neutral atom into an optical microscopic tweezer

    Institute of Scientific and Technical Information of China (English)

    何军; 刘贝; 刁文婷; 王杰英; 靳刚; 王军民

    2015-01-01

    A single atom in a magneto–optical trap (MOT) with trap size (hundreds of micrometers) can be transferred into an optical microscopic tweezer with a probability of∼100%. The ability to transfer a single atom into two traps back and forth allows us to study the loading process. The loading probability is found to be insensitive to the geometric overlap of the MOT and the tweezer. It is therefore possible to perform simultaneously loading of a single atom into all sites of the tweezer array for many qubits. In particular, we present a simulation of the one-dimensional and two-dimensional arrays of an optical microscopic tweezer. We find the same qualitative behavior for all of the trap parameters.

  5. Taking Nanomedicine Teaching into Practice with Atomic Force Microscopy and Force Spectroscopy

    Science.gov (United States)

    Carvalho, Filomena A.; Freitas, Teresa; Santos, Nuno C.

    2015-01-01

    Atomic force microscopy (AFM) is a useful and powerful tool to study molecular interactions applied to nanomedicine. The aim of the present study was to implement a hands-on atomic AFM course for graduated biosciences and medical students. The course comprises two distinct practical sessions, where students get in touch with the use of an atomic…

  6. Learning scheme to predict atomic forces and accelerate materials simulations

    Science.gov (United States)

    Botu, V.; Ramprasad, R.

    2015-09-01

    The behavior of an atom in a molecule, liquid, or solid is governed by the force it experiences. If the dependence of this vectorial force on the atomic chemical environment can be learned efficiently with high fidelity from benchmark reference results—using "big-data" techniques, i.e., without resorting to actual functional forms—then this capability can be harnessed to enormously speed up in silico materials simulations. The present contribution provides several examples of how such a force field for Al can be used to go far beyond the length-scale and time-scale regimes presently accessible using quantum-mechanical methods. It is argued that pathways are available to systematically and continuously improve the predictive capability of such a learned force field in an adaptive manner, and that this concept can be generalized to include multiple elements.

  7. Properties of Atoms in Molecules:  Caged Atoms and the Ehrenfest Force.

    Science.gov (United States)

    Bader, Richard F W; Fang, De-Cai

    2005-05-01

    This paper uses the properties of atom X enclosed within an adamantane cage, denoted by X@C10H16, as a vehicle to introduce the Ehrenfest force into the discussion of bonding, the properties being determined by the physics of an open system. This is the force acting on an atom in a molecule and determining the potential energy appearing in Slater's molecular virial theorem. The Ehrenfest force acting across the interatomic surface of a bonded pair atoms [Formula: see text] atoms linked by a bond path [Formula: see text] is attractive, each atom being drawn toward the other, and the associated surface virial that measures the contribution to the energy arising from the formation of the surface is stabilizing. It is the Ehrenfest force that determines the adhesive properties of surfaces. The endothermicity of formation for X = He or Ne is not a result of instabilities incurred in the interaction of X with the four methine carbons to which it is bonded, interactions that are stabilizing both in terms of the changes in the atomic energies and in the surface virials. The exothermicity for X = Be(2+), B(3+), and Al(3+) is a consequence of the transfer of electron density from the hydrogen atoms to the carbon and X atoms, the exothermicity increasing with charge transfer despite an increase in the contained volume of X. PMID:26641507

  8. Properties of Atoms in Molecules:  Caged Atoms and the Ehrenfest Force.

    Science.gov (United States)

    Bader, Richard F W; Fang, De-Cai

    2005-05-01

    This paper uses the properties of atom X enclosed within an adamantane cage, denoted by X@C10H16, as a vehicle to introduce the Ehrenfest force into the discussion of bonding, the properties being determined by the physics of an open system. This is the force acting on an atom in a molecule and determining the potential energy appearing in Slater's molecular virial theorem. The Ehrenfest force acting across the interatomic surface of a bonded pair atoms [Formula: see text] atoms linked by a bond path [Formula: see text] is attractive, each atom being drawn toward the other, and the associated surface virial that measures the contribution to the energy arising from the formation of the surface is stabilizing. It is the Ehrenfest force that determines the adhesive properties of surfaces. The endothermicity of formation for X = He or Ne is not a result of instabilities incurred in the interaction of X with the four methine carbons to which it is bonded, interactions that are stabilizing both in terms of the changes in the atomic energies and in the surface virials. The exothermicity for X = Be(2+), B(3+), and Al(3+) is a consequence of the transfer of electron density from the hydrogen atoms to the carbon and X atoms, the exothermicity increasing with charge transfer despite an increase in the contained volume of X.

  9. Using Atom Interferometry to Search for New Forces

    Energy Technology Data Exchange (ETDEWEB)

    Wacker, Jay G.; /SLAC

    2009-12-11

    Atom interferometry is a rapidly advancing field and this Letter proposes an experiment based on existing technology that can search for new short distance forces. With current technology it is possible to improve the sensitivity by up to a factor of 10{sup 2} and near-future advances will be able to rewrite the limits for forces with ranges from 100 {micro}m to 1km.

  10. Large momentum transfer atom interferometry with Coriolis force compensation

    Science.gov (United States)

    Kuan, Pei-Chen; Lan, Shau-Yu; Estey, Brian; Haslinger, Philipp; Mueller, Holger

    2012-06-01

    Light-pulse atom interferometers use atom-photon interactions to coherently split, guide, and recombine freely falling matter-waves. Because of Earth's rotation, however, the matter-waves do not recombine precisely, which causes severe loss of contrast in large space-time atom interferometers. I will present our recent progress in using a tip-tilt mirror to remove the influence of the Coriolis force from Earth's rotation. Therefore, we improve the contrast and suppress systematic effects, also reach what is to our knowledge the largest spacetime area.

  11. Will a decaying atom feel a friction force?

    CERN Document Server

    Sonnleitner, Matthias; Barnett, Stephen M

    2016-01-01

    We show how a simple calculation leads to the surprising result that an excited two-level atom moving through vacuum sees a tiny friction force of first order in v/c. At first sight this seems to be in obvious contradiction to other calculations showing that the interaction with the vacuum does not change the velocity of an atom. It is yet more surprising that this change in the atom's momentum turns out to be a necessary result of energy and momentum conservation in special relativity.

  12. Cooperative scattering and radiation pressure force in dense atomic clouds

    CERN Document Server

    Bachelard, Romain; Courteille, Philippe

    2011-01-01

    We consider the collective scattering by a cloud of $N$ two-level atoms driven by an uniform radiation field. Dense atomic clouds can be described by a continuous density and the problem reduces to deriving the spectrum of the atom-atom coupling operator. For clouds much larger than the optical wavelength, the spectrum is treated as a continuum, and analytical expressions for several macroscopic quantities, such as scattered radiation intensity and radiation pressure force, are derived. The analytical results are then compared to the exact $N$-body solution and with those obtained assuming a symmetric timed Dicke state. In contrast with the symmetric timed Dicke state, our calculations takes account of the back action of the atoms on the driving field leading to phase shifts due to the finite refraction of the cloud.

  13. Monitoring the osmotic response of single yeast cells through force measurement in the environmental scanning electron microscope

    International Nuclear Information System (INIS)

    We present a measurement system that combines an environmental scanning electron microscope (ESEM) and an atomic force microscope (AFM). This combination enables studies of static and dynamic mechanical properties of hydrated specimens, such as individual living cells. The integrated AFM sensor provides direct and continuous force measurement based on piezoresistive force transduction, allowing the recording of events in the millisecond range. The in situ ESEM-AFM setup was used to study Pichia pastoris wild-type yeast cells. For the first time, a quantified measure of the osmotic response of an individual yeast cell inside an ESEM is presented. With this technique, cell size changes due to humidity variations can be monitored with nanometre accuracy. In addition, mechanical properties were extracted from load–displacement curves. A Young's modulus of 13–15 MPa was obtained for the P. pastoris yeast cells. The developed method is highly interesting as a complementary tool for the screening of drugs directed towards cellular water transport activity and provides new possibilities of studying mechanosensitive regulation of aquaporins. (paper)

  14. Force-Mediated Kinetics of Single P-Selectin/Ligand Complexes Observed by Atomic Force Microscopy

    Science.gov (United States)

    Fritz, Jurgen; Katopodis, Andreas G.; Kolbinger, Frank; Anselmetti, Dario

    1998-10-01

    Leukocytes roll along the endothelium of postcapillary venules in response to inflammatory signals. Rolling under the hydrodynamic drag forces of blood flow is mediated by the interaction between selectins and their ligands across the leukocyte and endothelial cell surfaces. Here we present force-spectroscopy experiments on single complexes of P-selectin and P-selectin glycoprotein ligand-1 by atomic force microscopy to determine the intrinsic molecular properties of this dynamic adhesion process. By modeling intermolecular and intramolecular forces as well as the adhesion probability in atomic force microscopy experiments we gain information on rupture forces, elasticity, and kinetics of the P-selectin/P-selectin glycoprotein ligand-1 interaction. The complexes are able to withstand forces up to 165 pN and show a chain-like elasticity with a molecular spring constant of 5.3 pN nm-1 and a persistence length of 0.35 nm. The dissociation constant (off-rate) varies over three orders of magnitude from 0.02 s-1 under zero force up to 15 s-1 under external applied forces. Rupture force and lifetime of the complexes are not constant, but directly depend on the applied force per unit time, which is a product of the intrinsic molecular elasticity and the external pulling velocity. The high strength of binding combined with force-dependent rate constants and high molecular elasticity are tailored to support physiological leukocyte rolling.

  15. Simultaneous differential spinning disk fluorescence optical sectioning microscopy and nanomechanical mapping atomic force microscopy

    Energy Technology Data Exchange (ETDEWEB)

    Miranda, Adelaide; De Beule, Pieter A. A., E-mail: pieter.de-beule@inl.int [Applied Nano-Optics Laboratory, International Iberian Nanotechnology Laboratory, Avenida Mestre José Veiga, s/n, 4715-330 Braga (Portugal); Martins, Marco [Nano-ICs Group, International Iberian Nanotechnology Laboratory, Avenida Mestre José Veiga, s/n, 4715-330 Braga (Portugal)

    2015-09-15

    Combined microscopy techniques offer the life science research community a powerful tool to investigate complex biological systems and their interactions. Here, we present a new combined microscopy platform based on fluorescence optical sectioning microscopy through aperture correlation microscopy with a Differential Spinning Disk (DSD) and nanomechanical mapping with an Atomic Force Microscope (AFM). The illumination scheme of the DSD microscope unit, contrary to standard single or multi-point confocal microscopes, provides a time-independent illumination of the AFM cantilever. This enables a distortion-free simultaneous operation of fluorescence optical sectioning microscopy and atomic force microscopy with standard probes. In this context, we discuss sample heating due to AFM cantilever illumination with fluorescence excitation light. Integration of a DSD fluorescence optical sectioning unit with an AFM platform requires mitigation of mechanical noise transfer of the spinning disk. We identify and present two solutions to almost annul this noise in the AFM measurement process. The new combined microscopy platform is applied to the characterization of a DOPC/DOPS (4:1) lipid structures labelled with a lipophilic cationic indocarbocyanine dye deposited on a mica substrate.

  16. Simultaneous differential spinning disk fluorescence optical sectioning microscopy and nanomechanical mapping atomic force microscopy

    International Nuclear Information System (INIS)

    Combined microscopy techniques offer the life science research community a powerful tool to investigate complex biological systems and their interactions. Here, we present a new combined microscopy platform based on fluorescence optical sectioning microscopy through aperture correlation microscopy with a Differential Spinning Disk (DSD) and nanomechanical mapping with an Atomic Force Microscope (AFM). The illumination scheme of the DSD microscope unit, contrary to standard single or multi-point confocal microscopes, provides a time-independent illumination of the AFM cantilever. This enables a distortion-free simultaneous operation of fluorescence optical sectioning microscopy and atomic force microscopy with standard probes. In this context, we discuss sample heating due to AFM cantilever illumination with fluorescence excitation light. Integration of a DSD fluorescence optical sectioning unit with an AFM platform requires mitigation of mechanical noise transfer of the spinning disk. We identify and present two solutions to almost annul this noise in the AFM measurement process. The new combined microscopy platform is applied to the characterization of a DOPC/DOPS (4:1) lipid structures labelled with a lipophilic cationic indocarbocyanine dye deposited on a mica substrate

  17. Microbially influenced corrosion visualized by atomic force microscopy

    Science.gov (United States)

    Telegdi, J.; Keresztes, Z.; Pálinkás, G.; Kálmán, E.; Sand, W.

    Corrosion, biofilm formation and the adsorption of different, corrosion-enhancing microbes (such as Desulfovibrio desulfuricans, Thiobacillus ferrooxidans, Thiobacillus intermedius, Leptospirillum ferrooxidans, and mixed cultures) to different surfaces (iron, copper, pyrite) have been studied in aqueous environment by atomic force microscopy (AFM). It is one of the most effective on-line techniques for imaging surfaces (bacterial, metallic, etc.) with high resolution.

  18. Application of dynamic impedance spectroscopy to atomic force microscopy

    Directory of Open Access Journals (Sweden)

    Kazimierz Darowicki, Artur Zieliński and Krzysztof J Kurzydłowski

    2008-01-01

    Full Text Available Atomic force microscopy (AFM is a universal imaging technique, while impedance spectroscopy is a fundamental method of determining the electrical properties of materials. It is useful to combine those techniques to obtain the spatial distribution of an impedance vector. This paper proposes a new combining approach utilizing multifrequency scanning and simultaneous AFM scanning of an investigated surface.

  19. Minimizing tip-sample forces in jumping mode atomic force microscopy in liquid

    Energy Technology Data Exchange (ETDEWEB)

    Ortega-Esteban, A. [Departamento de Fisica de la Materia Condensada, C-3, Universidad Autonoma de Madrid, Cantoblanco, 28049 Madrid (Spain); Horcas, I. [Nanotec Electronica S.L., Centro Empresarial Euronova 3, Ronda de Poniente 12, 28760 Tres Cantos, Madrid (Spain); Hernando-Perez, M. [Departamento de Fisica de la Materia Condensada, C-3, Universidad Autonoma de Madrid, Cantoblanco, 28049 Madrid (Spain); Ares, P. [Nanotec Electronica S.L., Centro Empresarial Euronova 3, Ronda de Poniente 12, 28760 Tres Cantos, Madrid (Spain); Perez-Berna, A.J.; San Martin, C.; Carrascosa, J.L. [Centro Nacional de Biotecnologia (CNB-CSIC), Darwin 3, 28049 Madrid (Spain); Pablo, P.J. de [Departamento de Fisica de la Materia Condensada, C-3, Universidad Autonoma de Madrid, Cantoblanco, 28049 Madrid (Spain); Gomez-Herrero, J., E-mail: julio.gomez@uam.es [Departamento de Fisica de la Materia Condensada, C-3, Universidad Autonoma de Madrid, Cantoblanco, 28049 Madrid (Spain)

    2012-03-15

    Control and minimization of tip-sample interaction forces are imperative tasks to maximize the performance of atomic force microscopy. In particular, when imaging soft biological matter in liquids, the cantilever dragging force prevents identification of the tip-sample mechanical contact, resulting in deleterious interaction with the specimen. In this work we present an improved jumping mode procedure that allows detecting the tip-sample contact with high accuracy, thus minimizing the scanning forces ({approx}100 pN) during the approach cycles. To illustrate this method we report images of human adenovirus and T7 bacteriophage particles which are prone to uncontrolled modifications when using conventional jumping mode. -- Highlights: Black-Right-Pointing-Pointer Improvement in atomic force microscopy in buffer solution. Black-Right-Pointing-Pointer Peak force detection. Black-Right-Pointing-Pointer Subtracting the cantilever dragging force. Black-Right-Pointing-Pointer Forces in the 100 pN range. Black-Right-Pointing-Pointer Imaging of delicate viruses with atomic force microscopy.

  20. Geometric derivation of the microscopic stress: A covariant central force decomposition

    Science.gov (United States)

    Torres-Sánchez, Alejandro; Vanegas, Juan M.; Arroyo, Marino

    2016-08-01

    We revisit the derivation of the microscopic stress, linking the statistical mechanics of particle systems and continuum mechanics. The starting point in our geometric derivation is the Doyle-Ericksen formula, which states that the Cauchy stress tensor is the derivative of the free-energy with respect to the ambient metric tensor and which follows from a covariance argument. Thus, our approach to define the microscopic stress tensor does not rely on the statement of balance of linear momentum as in the classical Irving-Kirkwood-Noll approach. Nevertheless, the resulting stress tensor satisfies balance of linear and angular momentum. Furthermore, our approach removes the ambiguity in the definition of the microscopic stress in the presence of multibody interactions by naturally suggesting a canonical and physically motivated force decomposition into pairwise terms, a key ingredient in this theory. As a result, our approach provides objective expressions to compute a microscopic stress for a system in equilibrium and for force-fields expanded into multibody interactions of arbitrarily high order. We illustrate the proposed methodology with molecular dynamics simulations of a fibrous protein using a force-field involving up to 5-body interactions.

  1. Polar Metal Oxide Surfaces of MgAl2O4 and ZnO Studied with Non-Contact Atomic Force Microscopy

    DEFF Research Database (Denmark)

    Rasmussen, Morten Karstoft

    2011-01-01

    large and complicated surface reconstructions. However, by utilizing the non-contact atomic force microscope together with complimentary experimental techniques and theoretical calculations, the work presented in this thesis introduces a new general route for resolving the atomic structure of a polar...

  2. Atomic Force Microscopy Based Nanorobotics Modelling, Simulation, Setup Building and Experiments

    CERN Document Server

    Xie, Hui; Régnier, Stéphane; Sitti, Metin

    2012-01-01

    The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s. There have been many progress on modeling, imaging, teleoperated or automated control, human-machine interfacing, instrumentation, and applications of AFM based nanorobotic manipulation systems in literature. This book aims to include all of such state-of-the-art progress in an organized, structured, and detailed manner as a reference book and also potentially a textbook in nanorobotics and any other nanoscale dynamics, systems and controls related research and education. Clearly written and well-organized, this text introduces designs and prototypes of the nanorobotic systems in detail with innovative principles of three-dimensional manipulation force microscopy and parallel imaging/manipulation force microscopy.

  3. Atomic force microscopy and thermodynamics on taro, a self-cleaning plant leaf

    Science.gov (United States)

    Hüger, E.; Rothe, H.; Frant, M.; Grohmann, S.; Hildebrand, G.; Liefeith, K.

    2009-07-01

    The evolution-optimized leaves of Colocasia esculenta (taro) and Nelumbo nucifera (lotus) are the best optimized self-cleaning surfaces known to date. Using an atomic force microscope device equipped with a piezodriven sample stage which enables a z-range of 100 μm we measured the surface morphology of dried and undried leaves of Colocasia esculenta. Thermodynamic calculations were done to investigate the interaction strength of a water droplet with the surfaces of the morphology shown in the images. The results show that the hierarchical structure produces a stable superhydrophobic state with optimal self-cleaning properties.

  4. Characterization of microfabricated probes for combined atomic force and high-resolution scanning electrochemical microscopy.

    Science.gov (United States)

    Gullo, Maurizio R; Frederix, Patrick L T M; Akiyama, Terunobu; Engel, Andreas; deRooij, Nico F; Staufer, Urs

    2006-08-01

    A combined atomic force and scanning electrochemical microscope probe is presented. The probe is electrically insulated except at the very apex of the tip, which has a radius of curvature in the range of 10-15 nm. Steady-state cyclic voltammetry measurements for the reduction of Ru(NH3)6Cl3 and feedback experiments showed a distinct and reproducible response of the electrode. These experimental results agreed with finite element simulations for the corresponding diffusion process. Sequentially topographical and electrochemical studies of Pt lines deposited onto Si3N4 and spaced 100 nm apart (edge to edge) showed a lateral electrochemical resolution of 10 nm. PMID:16878880

  5. Molecular positional order in Langmuir-Blodgett films by atomic force microscopy

    Energy Technology Data Exchange (ETDEWEB)

    Bourdieu, L.; Ronsin, O.; Chatenay, D. (Inst. Curie, Paris (France))

    1993-02-05

    Langmuir-Blodgett films of barium arachidate have been studied on both macroscopic and microscopic scales by atomic force microscopy. As prepared, the films exhibit a disordered hexagonal structure; molecularly resolved images in direct space establish a connection between the extent of the positional order and the presence of defects such as dislocations. Upon heating, the films reorganize into a more condensed state with a centered rectangular crystallographic arrangement; in this new state the films exhibit long-range positional order and unusual structural features, such as a height modulation of the arachidic acid molecules. 22 refs., 4 figs.

  6. Molecular Positional Order in Langmuir-Blodgett Films by Atomic Force Microscopy

    Science.gov (United States)

    Bourdieu, L.; Ronsin, O.; Chatenay, D.

    1993-02-01

    Langmuir-Blodgett films of barium arachidate have been studied on both macroscopic and microscopic scales by atomic force microscopy. As prepared, the films exhibit a disordered hexagonal structure; molecularly resolved images in direct space establish a connection between the extent of the positional order and the presence of defects such as dislocations. Upon heating, the films reorganize into a more condensed state with a centered rectangular crystallographic arrangement; in this new state the films exhibit long-range positional order and unusual structural features, such as a height modulation of the arachidic acid molecules.

  7. The study of 3-dimensional structures of IgG with atomic force microscopy

    Institute of Scientific and Technical Information of China (English)

    YU Yi-gang; XU Ru-xiang; JIANG Xiao-dan; KE Yi-quan

    2005-01-01

    Objective: To detect 3-dimensional images of anti-N-methyl-D-aspartate receptor Nr1 (NMDAr1) polycolonal IgG affixed on mica in physiological environment. Methods: The images and data were obtained from a contact mode and commercial Si3N4 probed tip by using atomic force microscope (AFM). Conclusions: Using AFM to investigate biomacromolecule can make us deeply understand the structure of IgG, which will instruct us to detect the membrane receptor protein as a labelling agent.

  8. Nanoscale spatially resolved simultaneous measurement of in-plane and out-of-plane force components on surfaces: a novel operational mode in atomic force microscopy

    Science.gov (United States)

    Watson, Gregory S.; Dinte, Bradley P.; Blach, Jolanta A.; Myhra, Sverre

    2002-11-01

    The atomic force microscope (AFM) allows investigation of the properties of surfaces and interfaces at atomic scale resolution. However, several different operational modes, (imaging, force versus distance and lateral force modes), need to be deployed in order to gain insight into the structure, tribological and mechanical properties. A new method, based on a variation of the force versus distance mode, has been developed. In essence, a coupling of the deformational modes of the probe is exploited whereby the tip is induced to undergo lateral travel in response to application of an out-of-plane force (and thus normal bending of the force-sensing lever). The lateral travel induces in-plane forces that are then measurable as a consequence of stimulation of the 'buckling' deformational mode of the lever. Due to the lever geometry, the technique offers an increase in resolution of an order of magnitude over existing AFM methods for measurement of atomic scale stick-slip events. In addition, the method allows measurement of the lateral deformation of the sample as well as scanner calibration. Outcomes will be demonstrated for atomically flat surfaces such as WTe2 and highly oriented pyrolytic graphite.

  9. Advances in Bichromatic Force Slowing of Atoms and Molecules

    Science.gov (United States)

    Chieda, M. A.; Eyler, E. E.

    2012-06-01

    The optical bichromatic force (BCF) holds promise as an efficient, simple, and compact means to slow atoms and molecules to MOT capture velocities.ootnotetextM. Cashen and H. Metcalf, JOSA B 20, 915 (2003).^,ootnotetextM. A. Chieda and E. E. Eyler, PRA 84, 063401 (2011). Metastable helium beams, with v˜1000 m/s, are especially worthwhile atomic candidates since they presently require Zeeman slowers with lengths of 2--3 m. We present a novel BCF decelerator in which the Doppler shifts are chirped to keep the force centered on the atoms as they slow. This is made possible by recent advances in high-power diode lasers and electronics, and avoids many of the problems of alternative designs using large detunings. Initial tests on He* atoms show encouraging results. Unlike atoms, direct laser slowing of molecules remains exceedingly difficult, although success with SrF has very recently been reported.ootnotetextJ. F. Barry, E. S. Shuman, E. B. Norrgard, and D. DeMille, to be published. We calculate that for molecules with near-cycling transitions, rapid laser BCF slowing should be possible.ootnotetextChieda, op. sit. For the CaF molecule, we predict slowing by δv = 150 m/s, enough to bring a buffer-gas cooled beam to rest. An experimental demonstration is in progress.

  10. Interaction between polystyrene spheres by atomic force microscopy

    CERN Document Server

    Looi, L

    2002-01-01

    The interaction between a single polystyrene particle and a polystyrene substrate has been previously reported by a number of investigators. However, the effects of relative humidity, applied load and contact time on the adhesion of polystyrene surfaces have not been investigated and these effects are poorly understood. It is the primary aim of the current work to characterise the effect of the aforementioned parameters on the adhesion of polystyrene surfaces using atomic force microscopy. The polystyrene used in this study contained 1% of di-vinyl benzene as a cross-linking agent. From the work conducted using the custom-built instrument, the dependency of adhesion forces on the relative humidity is greatest at relative humidities above 60% where capillary forces cause a sharp increase in adhesion with increasing relative humidity. Hysteresis was observed in the solid-solid contact gradient of the accompanying force curves, suggesting non-elastic behaviour at the contact area of the surfaces

  11. Influence of the Coriolis force in atom interferometry.

    Science.gov (United States)

    Lan, Shau-Yu; Kuan, Pei-Chen; Estey, Brian; Haslinger, Philipp; Müller, Holger

    2012-03-01

    In a light-pulse atom interferometer, we use a tip-tilt mirror to remove the influence of the Coriolis force from Earth's rotation and to characterize configuration space wave packets. For interferometers with a large momentum transfer and large pulse separation time, we improve the contrast by up to 350% and suppress systematic effects. We also reach what is to our knowledge the largest space-time area enclosed in any atom interferometer to date. We discuss implications for future high-performance instruments.

  12. Self-oscillating tapping mode atomic force microscopy

    Science.gov (United States)

    Manning, L.; Rogers, B.; Jones, M.; Adams, J. D.; Fuste, J. L.; Minne, S. C.

    2003-09-01

    A piezoelectric microcantilever probe is demonstrated as a self-oscillator used for tapping mode atomic force microscopy. The integrated piezoelectric film on the cantilever serves as the frequency-determining component of an oscillator circuit; oscillation near the cantilever's resonant frequency is maintained by applying positive feedback to the film via this circuit. This new mode, which is a step towards more compact and parallel tapping mode AFM imaging, is demonstrated by imaging an evaporated gold film on a silicon substrate. A self-oscillating frequency spectrum and a force-distance curve are also presented.

  13. High Resolution Imaging by Atomic Force Microscopy: Contribution of short-range force to the imaging

    Science.gov (United States)

    Eguchi, Toyoaki; Kotone, Akiyama; Masanori, Ono; Toshio, Sakurai; Yukio, Hasegawa

    2003-03-01

    Recent developments in force detection technique have made us possible to obtain atomically resolved images of the Si(111)-(7x7) surface by AFM. Compared with STM, however, its spatial resolution remains limited. In this presentation, we demonstrate that with careful pretreatment and appropriate experimental parameters, the structure of the rest-atom layer can be imaged using AFM by detecting the short-range force due to the single chemical bonding. The detection of the short-range force is verified by analysis of the frequency-shift versus distance curve (force curve). This unprecedented high resolution is achieved by reducing background forces due to the long-range interactions with small oscillation amplitude of the cantilever and an atomically sharp tip. The high temperature annealing of the cantilever assists in obtaining a bare silicon tip on the cantilever without unwanted tip-blunting, and improving the Q-factor of the cantilever. This study implies that characterization of the AFM tip in nanometer scale, not only on the apex atoms but also its shape near the apex, is important and critical for AFM high resolution imaging.

  14. Evaporation based micro pump integrated into a scanning force microscope probe

    OpenAIRE

    Heuck, F.; Hug, T.; Akiyama, Terunobu; Frederix, P. L. T. M.; Engel, A.; Meister, André; Heinzelmann, Harry; de Rooij, Nicolaas F.; Staufer, Urs

    2010-01-01

    A micro pump was integrated into a scanning force microscope probe for circulating liquid through its hollow cantilever and tip. The interior cross section of the cantilever was 2.25 μm × 3.75 μm. All fluidic parts were made of SiO2, while the tip apex was made of Si3N4. The key fabrication techniques were silicon wafer bonding and wet-oxidation. The pumping mechanism was relying on the enhanced evaporation at an enlarged water/air interface at the exit of the microchannel. Capillary forces c...

  15. EOS of neutron-rich matter with a microscopic three-body force

    Energy Technology Data Exchange (ETDEWEB)

    Zuo, Wei [Chinese Academy of Sciences, Institute of Modern Physics, Lanzhou (China); Lejeune, Andre [Institut de Physique, Liege (Belgium); Lombardo, Umberto [INFN-LNS, Catania (Italy); Mathiot, Jean-Francois [CNRS-IN2P3, Laboratoire de Physique Corpusculaire, Aubiere Cedex (France)

    2002-12-01

    The equation of state of neutron-rich matter is studied in the framework of the Brueckner-Bethe-Goldstone approach. In addition to the bare two-body force a microscopic three-body force, based on the meson exchange model, has been introduced that largely improves the saturation properties of nuclear matter. Systematic calculations for several densities and isospin asymmetries show that the symmetry energy drives the isospin effects up to large densities and asymmetries. The density dependence of the symmetry energy is also discussed and compared with other predictions. (author)

  16. Dissipative binding of atoms by non-conservative forces

    CERN Document Server

    Lemeshko, Mikhail

    2013-01-01

    The formation of molecules and supramolecular structures results from bonding by conservative forces acting among electrons and nuclei and giving rise to equilibrium configurations defined by minima of the interaction potential. Here we show that bonding can also occur by the non-conservative forces responsible for interaction-induced coherent population trapping. The bound state arises in a dissipative process and manifests itself as a stationary state at a preordained interatomic distance. Remarkably, such a dissipative bonding is present even when the interactions among the atoms are purely repulsive. The dissipative bound states can be created and studied spectroscopically in present-day experiments with ultracold atoms or molecules and can potentially serve for cooling strongly interacting quantum gases.

  17. Atomic force microscopy in biomedical research - Methods and protocols

    Directory of Open Access Journals (Sweden)

    CarloAlberto Redi

    2011-11-01

    Full Text Available Pier Carlo Braga and Davide Ricci are old friends not only for those researchers familiar with Atomic force microscopy (AFM but also for those beginners (like the undersigned that already enthusiastically welcomed their 2004 edition (for the same Humana press printing types of Atomic force microscopy: Biomedical methods and applications, eventhough I never had used the AFM. That book was much intended to overview the possible AFM applications for a wide range of readers so that they can be in some way stimulated toward the AFM use. In fact, the great majority of scientists is afraid both of the technology behind AFM (that is naturally thought highly demanding in term of concepts not so familiar to biologists and physicians and of the financial costs: both these two factors are conceived unapproachable by the medium range granted scientist usually not educated in terms of biophysics and electronic background....

  18. Imaging stability in force-feedback high-speed atomic force microscopy

    Energy Technology Data Exchange (ETDEWEB)

    Kim, Byung I., E-mail: ByungKim@boisestate.edu [Department of Physics, Boise State University, 1910 University Drive Boise, ID 83725-1570, United States of America (United States); Boehm, Ryan D. [Department of Physics, Boise State University, 1910 University Drive Boise, ID 83725-1570, United States of America (United States)

    2013-02-15

    We studied the stability of force-feedback high-speed atomic force microscopy (HSAFM) by imaging soft, hard, and biological sample surfaces at various applied forces. The HSAFM images showed sudden topographic variations of streaky fringes with a negative applied force when collected on a soft hydrocarbon film grown on a grating sample, whereas they showed stable topographic features with positive applied forces. The instability of HSAFM images with the negative applied force was explained by the transition between contact and noncontact regimes in the force–distance curve. When the grating surface was cleaned, and thus hydrophilic by removing the hydrocarbon film, enhanced imaging stability was observed at both positive and negative applied forces. The higher adhesive interaction between the tip and the surface explains the improved imaging stability. The effects of imaging rate on the imaging stability were tested on an even softer adhesive Escherichia coli biofilm deposited onto the grating structure. The biofilm and planktonic cell structures in HSAFM images were reproducible within the force deviation less than ∼0.5 nN at the imaging rate up to 0.2 s per frame, suggesting that the force-feedback HSAFM was stable for various imaging speeds in imaging softer adhesive biological samples. - Highlights: ► We investigated the imaging stability of force-feedback HSAFM. ► Stable–unstable imaging transitions rely on applied force and sample hydrophilicity. ► The stable–unstable transitions are found to be independent of imaging rate.

  19. Investigating self-assembled protein nanotubes using atomic force microscopy

    OpenAIRE

    Niu, Lijiang

    2009-01-01

    Self-assembled protein nanotubular materials are attractive as putative building blocks for a variety of applications. Knowledge of the three-dimensional structures and the physical properties of these protein nanotubes then becomes a prerequisite for their use in rational materials design. The main purpose of the work presented in this thesis is to investigate both the structural and mechanical properties of protein nanotubes utilizing atomic force microscopy (AFM). Several different protein...

  20. Probing stem cell differentiation using atomic force microscopy

    Science.gov (United States)

    Liang, Xiaobin; Shi, Xuetao; Ostrovidov, Serge; Wu, Hongkai; Nakajima, Ken

    2016-03-01

    A real-time method using atomic force microscopy (AFM) was developed to probe stem cell differentiation by measuring the mechanical properties of cells and the extracellular matrix (ECM). The mechanical properties of stem cells and their ECMs can be used to clearly distinguish specific stem cell-differentiated lineages. It is clear that AFM is a facile and useful tool for monitoring the differentiation of stem cells in a non-invasive manner.

  1. Comparative study of clinical pulmonary surfactants using atomic force microscopy

    OpenAIRE

    Zhang, Hong; Fan, Qihui; Wang, Yi E.; Neal, Charles R.; Zuo, Yi Y.

    2011-01-01

    Clinical pulmonary surfactant is routinely used to treat premature newborns with respiratory distress syndrome, and has shown great potential in alleviating a number of neonatal and adult respiratory diseases. Despite extensive study of chemical composition, surface activity, and clinical performance of various surfactant preparations, a direct comparison of surfactant films is still lacking. In this study, we use atomic force microscopy to characterize and compare four animal-derived clinica...

  2. Cooperative scattering and radiation pressure force in dense atomic clouds

    Energy Technology Data Exchange (ETDEWEB)

    Bachelard, R. [University of Nova Gorica, School of Applied Sciences, Vipavska 11c SI-5270 Ajdovscina (Slovenia); Piovella, N. [Dipartimento di Fisica, Universita Degli Studi di Milano, Via Celoria 16, I-20133 Milano (Italy); Courteille, Ph. W. [Instituto de Fisica de Sao Carlos, Universidade de Sao Paulo, 13560-970 Sao Carlos, SP (Brazil)

    2011-07-15

    Atomic clouds prepared in ''timed Dicke'' states, i.e. states where the phase of the oscillating atomic dipole moments linearly varies along one direction of space, are efficient sources of superradiant light emission [Scully et al., Phys. Rev. Lett. 96, 010501 (2006)]. Here, we show that, in contrast to previous assertions, timed Dicke states are not the states automatically generated by incident laser light. In reality, the atoms act back on the driving field because of the finite refraction of the cloud. This leads to nonuniform phase shifts, which, at higher optical densities, dramatically alter the cooperative scattering properties, as we show by explicit calculation of macroscopic observables, such as the radiation pressure force.

  3. Uncertainties in forces extracted from non-contact atomic force microscopy measurements by fitting of long-range background forces

    Directory of Open Access Journals (Sweden)

    Adam Sweetman

    2014-04-01

    Full Text Available In principle, non-contact atomic force microscopy (NC-AFM now readily allows for the measurement of forces with sub-nanonewton precision on the atomic scale. In practice, however, the extraction of the often desired ‘short-range’ force from the experimental observable (frequency shift is often far from trivial. In most cases there is a significant contribution to the total tip–sample force due to non-site-specific van der Waals and electrostatic forces. Typically, the contribution from these forces must be removed before the results of the experiment can be successfully interpreted, often by comparison to density functional theory calculations. In this paper we compare the ‘on-minus-off’ method for extracting site-specific forces to a commonly used extrapolation method modelling the long-range forces using a simple power law. By examining the behaviour of the fitting method in the case of two radically different interaction potentials we show that significant uncertainties in the final extracted forces may result from use of the extrapolation method.

  4. Harnessing the damping properties of materials for high-speed atomic force microscopy

    Science.gov (United States)

    Adams, Jonathan D.; Erickson, Blake W.; Grossenbacher, Jonas; Brugger, Juergen; Nievergelt, Adrian; Fantner, Georg E.

    2016-02-01

    The success of high-speed atomic force microscopy in imaging molecular motors, enzymes and microbes in liquid environments suggests that the technique could be of significant value in a variety of areas of nanotechnology. However, the majority of atomic force microscopy experiments are performed in air, and the tapping-mode detection speed of current high-speed cantilevers is an order of magnitude lower in air than in liquids. Traditional approaches to increasing the imaging rate of atomic force microscopy have involved reducing the size of the cantilever, but further reductions in size will require a fundamental change in the detection method of the microscope. Here, we show that high-speed imaging in air can instead be achieved by changing the cantilever material. We use cantilevers fabricated from polymers, which can mimic the high damping environment of liquids. With this approach, SU-8 polymer cantilevers are developed that have an imaging-in-air detection bandwidth that is 19 times faster than those of conventional cantilevers of similar size, resonance frequency and spring constant.

  5. Nanoscale Subsurface Imaging of Nanocomposites via Resonant Difference-Frequency Atomic Force Ultrasonic Microscopy

    Science.gov (United States)

    Cantrell, Sean A.; Cantrell, John H.; Lillehei, Peter T.

    2007-01-01

    A scanning probe microscope methodology, called resonant difference-frequency atomic force ultrasonic microscopy (RDF-AFUM), has been developed. The method employs an ultrasonic wave launched from the bottom of a sample while the cantilever of an atomic force microscope engages the sample top surface. The cantilever is driven at a frequency differing from the ultrasonic frequency by one of the contact resonance frequencies of the cantilever. The nonlinear mixing of the oscillating cantilever and the ultrasonic wave at the sample surface generates difference-frequency oscillations at the cantilever contact resonance. The resonance-enhanced difference-frequency signals are used to create amplitude and phase-generated images of nanoscale near-surface and subsurface features. RDF-AFUM phase images of LaRC-CP2 polyimide polymer containing embedded nanostructures are presented. A RDF-AFUM micrograph of a 12.7 micrometer thick film of LaRC-CP2 containing a monolayer of gold nanoparticles embedded 7 micrometers below the specimen surface reveals the occurrence of contiguous amorphous and crystalline phases within the bulk of the polymer and a preferential growth of the crystalline phase in the vicinity of the gold nanoparticles. A RDF-AFUM micrograph of LaRC-CP2 film containing randomly dispersed carbon nanotubes reveals the growth of an interphase region at certain nanotube-polymer interfaces.

  6. Imaging stability in force-feedback high-speed atomic force microscopy.

    Science.gov (United States)

    Kim, Byung I; Boehm, Ryan D

    2013-02-01

    We studied the stability of force-feedback high-speed atomic force microscopy (HSAFM) by imaging soft, hard, and biological sample surfaces at various applied forces. The HSAFM images showed sudden topographic variations of streaky fringes with a negative applied force when collected on a soft hydrocarbon film grown on a grating sample, whereas they showed stable topographic features with positive applied forces. The instability of HSAFM images with the negative applied force was explained by the transition between contact and noncontact regimes in the force-distance curve. When the grating surface was cleaned, and thus hydrophilic by removing the hydrocarbon film, enhanced imaging stability was observed at both positive and negative applied forces. The higher adhesive interaction between the tip and the surface explains the improved imaging stability. The effects of imaging rate on the imaging stability were tested on an even softer adhesive Escherichia coli biofilm deposited onto the grating structure. The biofilm and planktonic cell structures in HSAFM images were reproducible within the force deviation less than ∼0.5 nN at the imaging rate up to 0.2s per frame, suggesting that the force-feedback HSAFM was stable for various imaging speeds in imaging softer adhesive biological samples. PMID:23274682

  7. Hierarchical atom type definitions and extensible all-atom force fields.

    Science.gov (United States)

    Jin, Zhao; Yang, Chunwei; Cao, Fenglei; Li, Feng; Jing, Zhifeng; Chen, Long; Shen, Zhe; Xin, Liang; Tong, Sijia; Sun, Huai

    2016-03-15

    The extensibility of force field is a key to solve the missing parameter problem commonly found in force field applications. The extensibility of conventional force fields is traditionally managed in the parameterization procedure, which becomes impractical as the coverage of the force field increases above a threshold. A hierarchical atom-type definition (HAD) scheme is proposed to make extensible atom type definitions, which ensures that the force field developed based on the definitions are extensible. To demonstrate how HAD works and to prepare a foundation for future developments, two general force fields based on AMBER and DFF functional forms are parameterized for common organic molecules. The force field parameters are derived from the same set of quantum mechanical data and experimental liquid data using an automated parameterization tool, and validated by calculating molecular and liquid properties. The hydration free energies are calculated successfully by introducing a polarization scaling factor to the dispersion term between the solvent and solute molecules. © 2015 Wiley Periodicals, Inc.

  8. Hierarchical atom type definitions and extensible all-atom force fields.

    Science.gov (United States)

    Jin, Zhao; Yang, Chunwei; Cao, Fenglei; Li, Feng; Jing, Zhifeng; Chen, Long; Shen, Zhe; Xin, Liang; Tong, Sijia; Sun, Huai

    2016-03-15

    The extensibility of force field is a key to solve the missing parameter problem commonly found in force field applications. The extensibility of conventional force fields is traditionally managed in the parameterization procedure, which becomes impractical as the coverage of the force field increases above a threshold. A hierarchical atom-type definition (HAD) scheme is proposed to make extensible atom type definitions, which ensures that the force field developed based on the definitions are extensible. To demonstrate how HAD works and to prepare a foundation for future developments, two general force fields based on AMBER and DFF functional forms are parameterized for common organic molecules. The force field parameters are derived from the same set of quantum mechanical data and experimental liquid data using an automated parameterization tool, and validated by calculating molecular and liquid properties. The hydration free energies are calculated successfully by introducing a polarization scaling factor to the dispersion term between the solvent and solute molecules. © 2015 Wiley Periodicals, Inc. PMID:26537332

  9. Gentle and fast atomic force microscopy with a piezoelectric scanning probe for nanorobotics applications

    International Nuclear Information System (INIS)

    A novel dual tip nanomanipulation atomic force microscope (AFM) platform operating in ambient conditions is presented. The system is equipped with a high frequency quartz piezoelectric self-sensing scanning probe for fast imaging and a passive cantilever for manipulation. The system is validated by imaging and selective pushing/pulling of gold colloid beads (diameters from 80 to 180 nm). This provides a more compact integration compared to an external optical lever and avoids several of its drawbacks such as optical interference and noise, and recalibration in the case of a moving cantilever and a fixed laser source and photodiode sensor. Moreover, as the quartz oscillator exhibits oscillation amplitudes in the sub-picometer range with a resonant frequency in the megahertz range, this dynamic force sensor is ideal for fast AFM imaging. Experiments show an increase by five times in imaging speed compared to a classical AFM system. (paper)

  10. Elastic properties of polystyrene nanospheres evaluated with atomic force microscopy: size effect and error analysis.

    Science.gov (United States)

    Guo, Dan; Li, Jingnan; Xie, Guoxin; Wang, Yuanyuan; Luo, Jianbin

    2014-06-24

    The mechanical properties of polystyrene (PS) nanospheres of ca. 50-1000 nm in diameter were evaluated by using an atomic force microscope (AFM). The compressive elastic moduli of individual nanospheres were obtained by analyzing the AFM force-displacement curves on the basis of the Hertz and JKR contact theories. The results showed that the elastic moduli of PS nanospheres of different sizes were in the range of 2-8 GPa. The elastic modulus of PS nanospheres increased with the decrease of the sphere diameter, especially when the diameter was less than 200 nm. The measurement errors due to tip wear and the deformation at the bottom of the sphere were analyzed. Mechanisms for the size dependence on the elastic modulus of PS nanospheres were also discussed. PMID:24892186

  11. Sub-cellular structure studied by combined atomic force-fluorescence microscopy

    Science.gov (United States)

    Trache, Andreea

    2009-03-01

    A novel experimental technique that integrates atomic force microscopy (AFM) with fluorescence imaging was used to study the role of extracellular matrix proteins in cellular organization. To understand the mechanism by which living cells sense mechanical forces, and how they respond and adapt to their environment, we developed a new technology able to investigate cellular behavior at sub-cellular level that integrates an AFM with total internal reflection fluorescence (TIRF) microscopy and fast-spinning disk (FSD) confocal microscopy. Live smooth muscle cells exhibited differences in focal adhesions and actin pattern depending on the extracellular matrix used for substrate coating. Data obtained by using the AFM-optical imaging integrated technique offer novel quantitative information that allows understanding the fundamental processes of cellular reorganization in response to extracellular matrix modulation. The integrated microscope presented here is broadly applicable across a wide range of molecular dynamic studies in any adherent live cells.

  12. An Atomic Force Microscopy based investigation of specific biomechanical properties for various types of neuronal cells

    Science.gov (United States)

    Spedden, Elise; White, James; Kaplan, David; Staii, Cristian

    2012-02-01

    Here we describe the use of Atomic Force Microscope (AFM) based techniques to characterize and explore the influence of biochemical and biomechanical cues on the growth and interaction of neuronal cells with surrounding guidance factors. Specifically, we use AFM topography and AFM force spectroscopy measurements to systematically investigate the morphology, elasticity, and real time growth of neuronal processes in the presence of different types of extracellular matrix proteins and growth factors. We therefore create a series of systems containing specified neuron densities where the type of the underlying growth promoting protein is different from sample to sample. For each system we measure key biomechanical parameters related to neuronal growth such as height and elastic modulus at multiple growth points on several types of neurons. We show that systematic measurements of these parameters yield fundamental information about the role played by substrate-plated guidance factors in determining elastic and morphological properties of neurons during growth.

  13. Nano-rheology of hydrogels using direct drive force modulation atomic force microscopy.

    Science.gov (United States)

    Nalam, Prathima C; Gosvami, Nitya N; Caporizzo, Matthew A; Composto, Russell J; Carpick, Robert W

    2015-11-01

    We present a magnetic force-based direct drive modulation method to measure local nano-rheological properties of soft materials across a broad frequency range (10 Hz to 2 kHz) using colloid-attached atomic force microscope (AFM) probes in liquid. The direct drive method enables artefact-free measurements over several decades of excitation frequency, and avoids the need to evaluate medium-induced hydrodynamic drag effects. The method was applied to measure the local mechanical properties of polyacrylamide hydrogels. The frequency-dependent storage stiffness, loss stiffness, and loss tangent (tan δ) were quantified for hydrogels having high and low crosslinking densities by measuring the amplitude and the phase response of the cantilever while the colloid was in contact with the hydrogel. The frequency bandwidth was further expanded to lower effective frequencies (0.1 Hz to 10 Hz) by obtaining force-displacement (FD) curves. Slow FD measurements showed a recoverable but highly hysteretic response, with the contact mechanical behaviour dependent on the loading direction: approach curves showed Hertzian behaviour while retraction curves fit the JKR contact mechanics model well into the adhesive regime, after which multiple detachment instabilities occurred. Using small amplitude dynamic modulation to explore faster rates, the load dependence of the storage stiffness transitioned from Hertzian to a dynamic punch-type (constant contact area) model, indicating significant influence of material dissipation coupled with adhesion. Using the appropriate contact model across the full frequency range measured, the storage moduli were found to remain nearly constant until an increase began near ∼100 Hz. The softer gels' storage modulus increased from 7.9 ± 0.4 to 14.5 ± 2.1 kPa (∼85%), and the stiffer gels' storage modulus increased from 16.3 ± 1.1 to 31.7 ± 5.0 kPa (∼95%). This increase at high frequencies may be attributed to a contribution from solvent

  14. Changes in the starch-protein interface depending on common wheat grain hardness revealed using atomic force microscopy

    OpenAIRE

    Chichti, Emna; GEORGE, MATTHIEU; Delenne, Jean-Yves; Lullien-pellerin, Valerie

    2015-01-01

    The Atomic Force Microscope tip was used to progressively abrade the surface of non-cutted starch granules embedded in the endosperm protein matrix in grain sections from wheat near-isogenic lines differing in the puroindoline b gene and thus hardness. In the hard near-isogenic wheat lines, starch granules exhibited two distinct profiles corresponding either to abrasion in the surrounding protein layer or the starch granule. An additional profile, only identified in soft lines, revealed a mar...

  15. Characterization and analysis of weld lines on micro-injection moulded parts using atomic force microscopy (AFM)

    DEFF Research Database (Denmark)

    Tosello, Guido; Gava, Alberto; Hansen, Hans Nørgaard;

    2009-01-01

    In recent years plastic moulding techniques, such as injection moulding, have been developed to fulfil the needs of micro-components fabrication. Micro-injection moulding (SLIM) is the process which enables the mass production of polymer micro-systems such as micro-mechanical parts, micro-fluidic...... injection moulding parameters on the weld lines' dimensions is presented, using an atomic force microscope (AFM). Depth and width of weld lines were chosen as parameters to be optimized....

  16. Force-gradient-induced mechanical dissipation of quartz tuning fork force sensors used in atomic force microscopy

    Energy Technology Data Exchange (ETDEWEB)

    Castellanos-Gomez, A. [Departamento de Fisica de la Materia Condensada (C-III), Universidad Autonoma de Madrid, Campus de Cantoblanco, 28049 Madrid (Spain); Agrait, N. [Departamento de Fisica de la Materia Condensada (C-III), Universidad Autonoma de Madrid, Campus de Cantoblanco, 28049 Madrid (Spain); Instituto Universitario de Ciencia de Materiales ' Nicolas Cabrera' , Universidad Autonoma de Madrid, Campus de Cantoblanco, 28049 Madrid (Spain); Instituto Madrileno de Estudios Avanzados en Nanociencia, IMDEA-Nanociencia, 28049 Madrid (Spain); Rubio-Bollinger, G., E-mail: gabino.rubio@uam.es [Departamento de Fisica de la Materia Condensada (C-III), Universidad Autonoma de Madrid, Campus de Cantoblanco, 28049 Madrid (Spain); Instituto Universitario de Ciencia de Materiales ' Nicolas Cabrera' , Universidad Autonoma de Madrid, Campus de Cantoblanco, 28049 Madrid (Spain)

    2011-02-15

    We have studied the dynamics of quartz tuning fork resonators used in atomic force microscopy taking into account the mechanical energy dissipation through the attachment of the tuning fork base. We find that the tuning fork resonator quality factor changes even in the case of a purely elastic sensor-sample interaction. This is due to the effective mechanical imbalance of the tuning fork prongs induced by the sensor-sample force gradient, which in turn has an impact on dissipation through the attachment of the resonator base. This effect may yield a measured dissipation signal that can be different from the one exclusively related to the dissipation between the sensor and the sample. We also find that there is a second-order term in addition to the linear relationship between the sensor-sample force gradient and the resonance frequency shift of the tuning fork that is significant even for force gradients usually present in atomic force microscopy, which are in the range of tens of N/m. -- Research Highlights: {yields} Dynamics of miniature tuning fork force sensors: a mechanical model. {yields} Non-linear relationship between resonance frequency shift and applied force gradient. {yields} An apparent mechanical dissipation channel opens even for purely conservative tip-sample interactions. {yields} qPlus tuning forks configuration has lower Q factor but straightforward dynamics.

  17. Characterization of new drug delivery nanosystems using atomic force microscopy

    Science.gov (United States)

    Spyratou, Ellas; Mourelatou, Elena A.; Demetzos, C.; Makropoulou, Mersini; Serafetinides, A. A.

    2015-01-01

    Liposomes are the most attractive lipid vesicles for targeted drug delivery in nanomedicine, behaving also as cell models in biophotonics research. The characterization of the micro-mechanical properties of drug carriers is an important issue and many analytical techniques are employed, as, for example, optical tweezers and atomic force microscopy. In this work, polyol hyperbranched polymers (HBPs) have been employed along with liposomes for the preparation of new chimeric advanced drug delivery nanosystems (Chi-aDDnSs). Aliphatic polyester HBPs with three different pseudogenerations G2, G3 and G4 with 16, 32, and 64 peripheral hydroxyl groups, respectively, have been incorporated in liposomal formulation. The atomic force microscopy (AFM) technique was used for the comparative study of the morphology and the mechanical properties of Chi-aDDnSs and conventional DDnS. The effects of both the HBPs architecture and the polyesters pseudogeneration number in the stability and the stiffness of chi-aDDnSs were examined. From the force-distance curves of AFM spectroscopy, the Young's modulus was calculated.

  18. Improved social force model based on exit selection for microscopic pedestrian simulation in subway station

    Institute of Scientific and Technical Information of China (English)

    郑勋; 李海鹰; 孟令云; 许心越; 陈旭

    2015-01-01

    An improved social force model based on exit selection is proposed to simulate pedestrians’ microscopic behaviors in subway station. The modification lies in considering three factors of spatial distance, occupant density and exit width. In addition, the problem of pedestrians selecting exit frequently is solved as follows: not changing to other exits in the affected area of one exit, using the probability of remaining preceding exit and invoking function of exit selection after several simulation steps. Pedestrians in subway station have some special characteristics, such as explicit destinations, different familiarities with subway station. Finally, Beijing Zoo Subway Station is taken as an example and the feasibility of the model results is verified through the comparison of the actual data and simulation data. The simulation results show that the improved model can depict the microscopic behaviors of pedestrians in subway station.

  19. Atomic-Scale Characterization and Manipulation of Freestanding Graphene Using Adapted Capabilities of a Scanning Tunneling Microscope

    Science.gov (United States)

    Barber, Steven

    Graphene was the first two-dimensional material ever discovered, and it exhibits many unusual phenomena important to both pure and applied physics. To ensure the purest electronic structure, or to study graphene's elastic properties, it is often suspended over holes or trenches in a substrate. The aim of the research presented in this dissertation was to develop methods for characterizing and manipulating freestanding graphene on the atomic scale using a scanning tunneling microscope (STM). Conventional microscopy and spectroscopy techniques must be carefully reconsidered to account for movement of the extremely flexible sample. First, the acquisition of atomic-scale images of freestanding graphene using the STM and the ability to pull the graphene perpendicular to its plane by applying an electrostatic force with the STM tip are demonstrated. The atomic-scale images contained surprisingly large corrugations due to the electrostatic attractive force varying in registry with the local density of states. Meanwhile, a large range of control over the graphene height at a point was obtained by varying the tip bias voltage, and the application to strain engineering of graphene's so-called pseudomagnetic field is examined. Next, the effect of the tunneling current was investigated. With increasing current, the graphene sample moves away from the tip rather than toward it. It was determined that this must be due to local heating by the electric current, causing the graphene to contract because it has a negative coefficient of thermal expansion. Finally, by imaging a very small area, the STM can monitor the height of one location over long time intervals. Results sometimes exhibit periodic behavior, with a frequency and amplitude that depend on the tunneling current. These fluctuations are interpreted as low-frequency flexural phonon modes within elasticity theory. All of these findings set the foundation for employing a STM in the study of freestanding graphene.

  20. Localization and force analysis at the single virus particle level using atomic force microscopy

    International Nuclear Information System (INIS)

    Highlights: ► Localization of single virus particle. ► Force measurements. ► Force mapping. -- Abstract: Atomic force microscopy (AFM) is a vital instrument in nanobiotechnology. In this study, we developed a method that enables AFM to simultaneously measure specific unbinding force and map the viral glycoprotein at the single virus particle level. The average diameter of virus particles from AFM images and the specificity between the viral surface antigen and antibody probe were integrated to design a three-stage method that sets the measuring area to a single virus particle before obtaining the force measurements, where the influenza virus was used as the object of measurements. Based on the purposed method and performed analysis, several findings can be derived from the results. The mean unbinding force of a single virus particle can be quantified, and no significant difference exists in this value among virus particles. Furthermore, the repeatability of the proposed method is demonstrated. The force mapping images reveal that the distributions of surface viral antigens recognized by antibody probe were dispersed on the whole surface of individual virus particles under the proposed method and experimental criteria; meanwhile, the binding probabilities are similar among particles. This approach can be easily applied to most AFM systems without specific components or configurations. These results help understand the force-based analysis at the single virus particle level, and therefore, can reinforce the capability of AFM to investigate a specific type of viral surface protein and its distributions.

  1. Combined atomic force microscopy and voltage pulse technique to accurately measure electrostatic force

    Science.gov (United States)

    Inami, Eiichi; Sugimoto, Yoshiaki

    2016-08-01

    We propose a new method of extracting electrostatic force. The technique is based on frequency modulation atomic force microscopy (FM-AFM) combined with a voltage pulse. In this method, the work that the electrostatic field does on the oscillating tip is measured through the cantilever energy dissipation. This allows us to directly extract capacitive forces including the longer range part, to which the conventional FM-AFM is insensitive. The distance-dependent contact potential difference, which is modulated by local charges distributed on the surfaces of the tip and/or sample, could also be correctly obtained. In the absence of local charges, our method can perfectly reproduce the electrostatic force as a function of the distance and the bias voltage. Furthermore, we demonstrate that the system serves as a sensitive sensor enabling us to check the existence of the local charges such as trapped charges and patch charges.

  2. Understanding the Plasmonics of Nanostructured Atomic Force Microscopy Tips

    CERN Document Server

    Sanders, Alan; Zhang, Liwu; Turek, Vladimir; Sigle, Daniel O; Lombardi, Anna; Weller, Lee; Baumberg, Jeremy J

    2016-01-01

    Structured metallic tips are increasingly important for optical spectroscopies such as tip-enhanced Raman spectroscopy (TERS), with plasmonic resonances frequently cited as a mechanism for electric field enhancement. We probe the local optical response of sharp and spherical-tipped atomic force microscopy (AFM) tips using a scanning hyperspectral imaging technique to identify plasmonic behaviour. Localised surface plasmon resonances which radiatively couple with far-field light are found only for spherical AFM tips, with little response for sharp AFM tips, in agreement with numerical simulations of the near-field response. The precise tip geometry is thus crucial for plasmon-enhanced spectroscopies, and the typical sharp cones are not preferred.

  3. Visualisation of xanthan conformation by atomic force microscopy.

    Science.gov (United States)

    Moffat, Jonathan; Morris, Victor J; Al-Assaf, Saphwan; Gunning, A Patrick

    2016-09-01

    Direct visual evidence obtained by atomic force microscopy demonstrates that when xanthan is adsorbed from aqueous solution onto the heterogeneously charged substrate mica, its helical conformation is distorted. Following adsorption it requires annealing for several hours to restore its ordered helical state. Once the helix state reforms, the AFM images obtained showed clear resolution of the periodicity with a value of 4.7nm consistent with the previously predicted models. In addition, the images also reveal evidence that the helix is formed by a double strand, a clarification of an ambiguity of the xanthan ultrastructure that has been outstanding for many years. PMID:27185152

  4. Microstructural Characterization of Hierarchical Structured Surfaces by Atomic Force Microscopy

    Science.gov (United States)

    Ponomareva, A. A.; Moshnikov, V. A.; Suchaneck, G.

    2013-12-01

    In this work, we evaluate the hierarchical surface topography of reactively sputtered nanocrystalline Pb(Zr,Ti)O3 and TiO2 thin films as well as plasma-treated antireflective PET films by means of determining the fractal dimension and power spectral density (PSD) of surface topography recorded by atomic force microscopy (AFM). Local fractal dimension was obtained using the triangulation method. The PSDs of all samples were fitted to the k-correlation model (also called ABC model) valid for a self-affine surface topography. Fractal analysis of AFM images was shown to be an appropriate and easy to use tool for the characterization of hierarchical nanostructures.

  5. CO tip functionalization in subatomic resolution atomic force microscopy

    Energy Technology Data Exchange (ETDEWEB)

    Kim, Minjung [Department of Chemical Engineering, The University of Texas at Austin, Austin, Texas 78712 (United States); Chelikowsky, James R. [Center for Computational Materials, Institute for Computational Engineering and Sciences, and Departments of Physics and Chemical Engineering, The University of Texas at Austin, Austin, Texas 78712 (United States)

    2015-10-19

    Noncontact atomic force microscopy (nc-AFM) employing a CO-functionalized tip displays dramatically enhanced resolution wherein covalent bonds of polycyclic aromatic hydrocarbon can be imaged. Employing real-space pseudopotential first-principles calculations, we examine the role of CO in functionalizing the nc-AFM tip. Our calculations allow us to simulate full AFM images and ascertain the enhancement mechanism of the CO molecule. We consider two approaches: one with an explicit inclusion of the CO molecule and one without. By comparing our simulations to existing experimental images, we ascribe the enhanced resolution of the CO functionalized tip to the special orbital characteristics of the CO molecule.

  6. Cryogel micromechanics unraveled by atomic force microscopy-based nanoindentation.

    Science.gov (United States)

    Welzel, Petra B; Friedrichs, Jens; Grimmer, Milauscha; Vogler, Steffen; Freudenberg, Uwe; Werner, Carsten

    2014-11-01

    Cell-instructive physical characteristics of macroporous scaffolds, developed for tissue engineering applications, often remain difficult to assess. Here, an atomic force microscopy-based nanoindentation approach is adapted to quantify the local mechanical properties of biohybrid glycosaminoglycan-poly(ethylene glycol) cryogels. Resulting from cryoconcentration effects upon gel formation, cryogel struts are observed to feature a higher stiffness compared to the corresponding bulk hydrogel materials. Local Young's moduli, porosity, and integral moduli of the cryogel scaffolds are compared in dependence on gel formation parameters. The results provide valuable insights into the cryogelation process and a base for adjusting physical characteristics of the obtained cryogel scaffolds, which can critically influence the cellular response.

  7. OBSERVATION OF DNA PARTIAL DENATURATION BY ATOMIC FORCE MICROSCOPY

    Institute of Scientific and Technical Information of China (English)

    Xin-hua Dai; Zhi-gang Wang; Bo Xiao; Yong-jun Zhang; Chen Wang; Chun-li Bai; Xiao-li Zhang; Jian Xu

    2004-01-01

    Atomic force microscopy was used to investigate the DNA-cetyltrimethylammonium bromide (CTAB) complexes adsorbed on highly ordered pyrolytic graphite (HOPG). These complexes, at low concentrations, can automatically spread out on the surface of HOPG. The DNA-CTAB complexes display a typically extended structure rather than a globular structure. Partially denaturated DNA produced by binding CTAB to DNA is directly observed by AFM with high resolution.The three-dimensional resolution of partially denaturated DNA obtained by AFM is not available by any other technique at present.

  8. Near-grain-boundary characterization by atomic force microscopy

    Energy Technology Data Exchange (ETDEWEB)

    Pramanick, A.K., E-mail: pramanick@nmlindia.org [MST Division, National Metallurgical Laboratory, Jamshedpur 831007 (India); Sinha, A. [MST Division, National Metallurgical Laboratory, Jamshedpur 831007 (India); Sastry, G.V.S. [Centre of Advanced Study, Department of Metallurgical Engineering, Institute of Technology, Banaras Hindu University, Varanasi 221005 (India); Ghosh, R.N. [MST Division, National Metallurgical Laboratory, Jamshedpur 831007 (India)

    2009-05-15

    Characterization of near-grain boundary is carried out by atomic force microscopy (AFM). It has been observed to be the most suitable technique owing to its capability to investigate the surface at high resolution. Commercial purity-grade nickel processed under different conditions, viz., (i) cold-rolled and annealed and (ii) thermally etched condition without cold rolling, is considered in the present study. AFM crystallographic data match well with the standard data. Hence, it establishes two grain-boundary relations viz., plane matching and coincidence site lattice (CSL {Sigma}=9) relation for the two different sample conditions.

  9. Single xanthan molecule preparation and atomic force microscopy observation

    International Nuclear Information System (INIS)

    A newly developed sample preparation technique termed multi-step spin-coating method was used to prepare well-dispersed xanthan molecules on bare mica, 3-aminopropyl triethoxysilane treated mica, nickel ion treated mica and highly oriented pyrolytic graphite, which are widely used as supporting surfaces in the atomic force microscopy (AFM) study. The substrate effects on conformation of single xanthan molecules were also investigated. We believe that this study is of great importance for the in-depth studies on xanthan molecules at the single-molecular level. (authors)

  10. Determination of hydration film thickness using atomic force microscopy

    Institute of Scientific and Technical Information of China (English)

    PENG Changsheng; SONG Shaoxian; GU Qingbao

    2005-01-01

    Dispersion of a solid particle in water may lead to the formation of hydration film on the particle surface, which can strongly increase the repulsive force between the particles and thus strongly affect the stability of dispersions. The hydration film thickness, which varies with the variation of property of suspension particles, is one of the most important parameters of hydration film, and is also one of the most difficult parameters that can be measured accurately. In this paper, a method, based on force-distance curve of atomic force microscopy, for determining the hydration film thickness of particles is developed. The method utilizes the difference of cantilever deflection before, between and after penetrating the hydration films between tip and sample, which reflect the difference of slope on the force-distance curve. 3 samples, mica, glass and stainless steel, were used for hydration thickness determination, and the results show that the hydration film thickness between silicon tip and mica, glass and stainless steel are 30.0(2.0, 29.0(1.0 and 32.5(2.5 nm, respectively.

  11. Nano-rheology of hydrogels using direct drive force modulation atomic force microscopy†

    Science.gov (United States)

    Nalam, Prathima C.; Gosvami, Nitya N.; Caporizzo, Matthew A.; Composto, Russell J.

    2016-01-01

    We present a magnetic force-based direct drive modulation method to measure local nano-rheological properties of soft materials across a broad frequency range (10 Hz to 2 kHz) using colloid-attached atomic force microscope (AFM) probes in liquid. The direct drive method enables artefact-free measurements over several decades of excitation frequency, and avoids the need to evaluate medium-induced hydrodynamic drag effects. The method was applied to measure the local mechanical properties of polyacrylamide hydrogels. The frequency-dependent storage stiffness, loss stiffness, and loss tangent (tan δ) were quantified for hydrogels having high and low crosslinking densities by measuring the amplitude and the phase response of the cantilever while the colloid was in contact with the hydrogel. The frequency bandwidth was further expanded to lower effective frequencies (0.1 Hz to 10 Hz) by obtaining force–displacement (FD) curves. Slow FD measurements showed a recoverable but highly hysteretic response, with the contact mechanical behaviour dependent on the loading direction: approach curves showed Hertzian behaviour while retraction curves fit the JKR contact mechanics model well into the adhesive regime, after which multiple detachment instabilities occurred. Using small amplitude dynamic modulation to explore faster rates, the load dependence of the storage stiffness transitioned from Hertzian to a dynamic punch-type (constant contact area) model, indicating significant influence of material dissipation coupled with adhesion. Using the appropriate contact model across the full frequency range measured, the storage moduli were found to remain nearly constant until an increase began near ∼100 Hz. The softer gels' storage modulus increased from 7.9 ± 0.4 to 14.5 ± 2.1 kPa (∼85%), and the stiffer gels' storage modulus increased from 16.3 ± 1.1 to 31.7 ± 5.0 kPa (∼95%). This increase at high frequencies may be attributed to a contribution from solvent

  12. Intermolecular forces between acetylcholine and acetylcholinesterases studied with atomic force microscopy

    Institute of Scientific and Technical Information of China (English)

    张英鸽; 白春礼; 王琛; 赵德禄; 苏明; 林璋; 田芳

    1999-01-01

    With the aid of atomic force microscopy, the intermolecular forces between acetyleholinesterases (AChE) and its natural substrate acetylcholine (ACh) have been studied. Through force spectrum measurement based on imaging of AChE molecules it was found that the attraction force between individual molecule pairs of ACh and AChE was (10±1) pN just before the quaternary ammonium head of ACh got into contact with the negative end of AChE and the decaying distance of attraction was (4±1) nm from the surface of ACHE. The adhesion force between individual ACh and AChE molecule pairs was (25±2) pN, which had a decaying feature of fast-slow-fast (FSF). The attraction forces between AChE and choline (Ch), the quaternary ammonium moiety and hydrolysate of ACh molecule, were similar to those between AChE and ACh. The adhesion forces between AChE and Ch were (20±2) pN, a little weaker than that between ACh and ACHE. These results indicated that AChE had a steering role for the diffusion of ACh toward it and had r

  13. High resolution atomic force microscopy of double-stranded RNA

    Science.gov (United States)

    Ares, Pablo; Fuentes-Perez, Maria Eugenia; Herrero-Galán, Elías; Valpuesta, José M.; Gil, Adriana; Gomez-Herrero, Julio; Moreno-Herrero, Fernando

    2016-06-01

    Double-stranded (ds) RNA mediates the suppression of specific gene expression, it is the genetic material of a number of viruses, and a key activator of the innate immune response against viral infections. The ever increasing list of roles played by dsRNA in the cell and its potential biotechnological applications over the last decade has raised an interest for the characterization of its mechanical properties and structure, and that includes approaches using Atomic Force Microscopy (AFM) and other single-molecule techniques. Recent reports have resolved the structure of dsDNA with AFM at unprecedented resolution. However, an equivalent study with dsRNA is still lacking. Here, we have visualized the double helix of dsRNA under near-physiological conditions and at sufficient resolution to resolve the A-form sub-helical pitch periodicity. We have employed different high-sensitive force-detection methods and obtained images with similar spatial resolution. Therefore, we show here that the limiting factors for high-resolution AFM imaging of soft materials in liquid medium are, rather than the imaging mode, the force between the tip and the sample and the sharpness of the tip apex.Double-stranded (ds) RNA mediates the suppression of specific gene expression, it is the genetic material of a number of viruses, and a key activator of the innate immune response against viral infections. The ever increasing list of roles played by dsRNA in the cell and its potential biotechnological applications over the last decade has raised an interest for the characterization of its mechanical properties and structure, and that includes approaches using Atomic Force Microscopy (AFM) and other single-molecule techniques. Recent reports have resolved the structure of dsDNA with AFM at unprecedented resolution. However, an equivalent study with dsRNA is still lacking. Here, we have visualized the double helix of dsRNA under near-physiological conditions and at sufficient resolution to

  14. On averaging force curves over heterogeneous surfaces in atomic force microscopy.

    Science.gov (United States)

    Sokolov, I; Kalaparthi, V; Kreshchuk, M; Dokukin, M E

    2012-10-01

    Atomic force microscopy (AFM) can be used to study mechanics at the nanoscale. Biological surfaces and nanocomposites have typically heterogeneous surfaces, both mechanically and chemically. When studying such surfaces with AFM, one needs to collect a large amount of data to make statistically sound conclusions. It is time- and resource-consuming to process each force curve separately. The analysis of an averaged raw force data is a simple and time saving option, which also averages out the noise and measurement artifacts of the force curves being analyzed. Moreover, some biomedical applications require just an average number per biological cell. Here we investigate such averaging, study the possible artifacts due to the averaging, and demonstrate how to minimize or even to avoid them. We analyze two ways of doing the averaging: over the force data for each particular distance (method 1, the most commonly used way), and over the distances for each particular force (method 2). We derive the errors of the methods in finding to the true average rigidity modulus. We show that both methods are accurate (the error is 100×), method 2 underestimates the average rigidity modulus by a factor of 2, whereas the error of method 1 is only 15%. However, when analyzing the different surface chemistry, which reveals itself in the changing long-range forces, the accuracy of the methods behave oppositely: method 1 can produce a noticeable averaging artifact in the deriving of the long-range forces; whereas method 2 can be successfully used to derive the averaged long-range force parameters without artifacts. We exemplify our conclusions by the study of human cervical cancer and normal epithelial cells, which demonstrate different degrees of heterogeneity. PMID:22917859

  15. A wireless centrifuge force microscope (CFM) enables multiplexed single-molecule experiments in a commercial centrifuge

    Science.gov (United States)

    Hoang, Tony; Patel, Dhruv S.; Halvorsen, Ken

    2016-08-01

    The centrifuge force microscope (CFM) was recently introduced as a platform for massively parallel single-molecule manipulation and analysis. Here we developed a low-cost and self-contained CFM module that works directly within a commercial centrifuge, greatly improving accessibility and ease of use. Our instrument incorporates research grade video microscopy, a power source, a computer, and wireless transmission capability to simultaneously monitor many individually tethered microspheres. We validated the instrument by performing single-molecule force shearing of short DNA duplexes. For a 7 bp duplex, we observed over 1000 dissociation events due to force dependent shearing from 2 pN to 12 pN with dissociation times in the range of 10-100 s. We extended the measurement to a 10 bp duplex, applying a 12 pN force clamp and directly observing single-molecule dissociation over an 85 min experiment. Our new CFM module facilitates simple and inexpensive experiments that dramatically improve access to single-molecule analysis.

  16. A wireless centrifuge force microscope (CFM) enables multiplexed single-molecule experiments in a commercial centrifuge.

    Science.gov (United States)

    Hoang, Tony; Patel, Dhruv S; Halvorsen, Ken

    2016-08-01

    The centrifuge force microscope (CFM) was recently introduced as a platform for massively parallel single-molecule manipulation and analysis. Here we developed a low-cost and self-contained CFM module that works directly within a commercial centrifuge, greatly improving accessibility and ease of use. Our instrument incorporates research grade video microscopy, a power source, a computer, and wireless transmission capability to simultaneously monitor many individually tethered microspheres. We validated the instrument by performing single-molecule force shearing of short DNA duplexes. For a 7 bp duplex, we observed over 1000 dissociation events due to force dependent shearing from 2 pN to 12 pN with dissociation times in the range of 10-100 s. We extended the measurement to a 10 bp duplex, applying a 12 pN force clamp and directly observing single-molecule dissociation over an 85 min experiment. Our new CFM module facilitates simple and inexpensive experiments that dramatically improve access to single-molecule analysis. PMID:27587129

  17. Dielectric spectroscopy at the nanoscale by atomic force microscopy: A simple model linking materials properties and experimental response

    International Nuclear Information System (INIS)

    The use of an atomic force microscope for studying molecular dynamics through dielectric spectroscopy with spatial resolution in the nanometer scale is a recently developed approach. However, difficulties in the quantitative connection of the obtained data and the material dielectric properties, namely, frequency dependent dielectric permittivity, have limited its application. In this work, we develop a simple electrical model based on physically meaningful parameters to connect the atomic force microscopy (AFM) based dielectric spectroscopy experimental results with the material dielectric properties. We have tested the accuracy of the model and analyzed the relevance of the forces arising from the electrical interaction with the AFM probe cantilever. In this way, by using this model, it is now possible to obtain quantitative information of the local dielectric material properties in a broad frequency range. Furthermore, it is also possible to determine the experimental setup providing the best sensitivity in the detected signal

  18. Gold-decorated highly ordered self-organized grating-like nanostructures on Ge surface: Kelvin probe force microscopy and conductive atomic force microscopy studies.

    Science.gov (United States)

    Mollick, Safiul Alam; Kumar, Mohit; Singh, Ranveer; Satpati, Biswarup; Ghose, Debabrata; Som, Tapobrata

    2016-10-28

    Nanoarchitecture by atomic manipulation is considered to be one of the emerging trends in advanced functional materials. It has a gamut of applications to offer in nanoelectronics, chemical sensing, and nanobiological science. In particular, highly ordered one-dimensional semiconductor nanostructures fabricated by self-organization methods are in high demand for their high aspect ratios and large number of applications. An efficient way of fabricating semiconductor nanostructures is by molecular beam epitaxy, where atoms are added to a crystalline surface at an elevated temperature during growth, yielding the desired structures in a self-assembled manner. In this article, we offer a room temperature process, in which atoms are sputtered away by ion impacts. Using gold ion implantation, the present study reports on the formation of highly ordered self-organized long grating-like nanostructures, with grooves between them, on a germanium surface. The ridges of the patterns are shown to have flower-like protruding nanostructures, which are mostly decorated by gold atoms. By employing local probe microscopic techniques like Kelvin probe force microscopy and conductive atomic force microscopy, we observe a spatial variation in the work function and different nanoscale electrical conductivity on the ridges of the patterns and the grooves between them, which can be attributed to gold atom decorated ridges. Thus, the architecture  presented offers the advantage of using the patterned germanium substrates as periodic arrays of conducting ridges and poorly conducting grooves between them. PMID:27655211

  19. Gold-decorated highly ordered self-organized grating-like nanostructures on Ge surface: Kelvin probe force microscopy and conductive atomic force microscopy studies

    Science.gov (United States)

    Alam Mollick, Safiul; Kumar, Mohit; Singh, Ranveer; Satpati, Biswarup; Ghose, Debabrata; Som, Tapobrata

    2016-10-01

    Nanoarchitecture by atomic manipulation is considered to be one of the emerging trends in advanced functional materials. It has a gamut of applications to offer in nanoelectronics, chemical sensing, and nanobiological science. In particular, highly ordered one-dimensional semiconductor nanostructures fabricated by self-organization methods are in high demand for their high aspect ratios and large number of applications. An efficient way of fabricating semiconductor nanostructures is by molecular beam epitaxy, where atoms are added to a crystalline surface at an elevated temperature during growth, yielding the desired structures in a self-assembled manner. In this article, we offer a room temperature process, in which atoms are sputtered away by ion impacts. Using gold ion implantation, the present study reports on the formation of highly ordered self-organized long grating-like nanostructures, with grooves between them, on a germanium surface. The ridges of the patterns are shown to have flower-like protruding nanostructures, which are mostly decorated by gold atoms. By employing local probe microscopic techniques like Kelvin probe force microscopy and conductive atomic force microscopy, we observe a spatial variation in the work function and different nanoscale electrical conductivity on the ridges of the patterns and the grooves between them, which can be attributed to gold atom decorated ridges. Thus, the architecture presented offers the advantage of using the patterned germanium substrates as periodic arrays of conducting ridges and poorly conducting grooves between them.

  20. Brown algal morphogenesis: Atomic Force Microscopy as a tool to study the role of mechanical forces

    Directory of Open Access Journals (Sweden)

    Benoit eTesson

    2014-09-01

    Full Text Available Over the last few years, a growing interest has been directed toward the use of macroalgae as a source of energy, food and molecules for the cosmetic and pharmaceutical industries. Besides this, macroalgal development remains poorly understood compared to other multicellular organisms. Brown algae (Phaeophyceae form a monophyletic lineage of usually large multicellular algae which evolved independently from land plants. In their environment, they are subjected to strong mechanical forces (current, waves and tide, in response to which they modify rapidly and reversibly their morphology. Because of their specific cellular features (cell wall composition, cytoskeleton organization, deciphering how they cope with these forces might help discover new control mechanisms of cell wall softening and cellulose synthesis. Despite the current scarcity in knowledge on brown algal cell wall dynamics and protein composition, we will illustrate, in the light of methods adapted to Ectocarpus siliculosus, to what extent atomic force microscopy can contribute to advance this field of investigation.

  1. Characterization of mitochondria isolated from normal and ischemic hearts in rats utilizing atomic force microscopy.

    Science.gov (United States)

    Lee, Gi-Ja; Chae, Su-Jin; Jeong, Jae Hoon; Lee, So-Ra; Ha, Sang-Jin; Pak, Youngmi Kim; Kim, Weon; Park, Hun-Kuk

    2011-04-01

    Mitochondria play critical roles in both the life and the death of cardiac myocytes. Various factors, such as the loss of ATP synthesis and increase of ATP hydrolysis, impairment in ionic homeostasis, formation of reactive oxygen species (ROS), and release of proapoptotic proteins are related to the generation of irreversible damage. It has been proposed that the release of cytochrome c is caused by a swelling of the mitochondrial matrix triggered by the apoptotic stimuli. However, there is a controversy about whether or not the mitochondria, indeed, swell during apoptosis. The major advantages of atomic force microscopy (AFM) over conventional optical and electron microscopes for bio-imaging include the fact that no special coating and vacuum are required and imaging can be done in all environments--air, vacuum or aqueous conditions. In addition, AFM force-distance curve measurements have become a fundamental tool in the fields of surface chemistry, biochemistry, and material science. In this study, we used AFM to observe the morphological and property changes in heart mitochondria that were isolated from a rat myocardial infarction model. From the shape parameters of the mitochondria in the AFM topographic image, it seemed that myocardial infarction caused the mitochondrial swelling. Also, the results of force-distance measurements showed that the adhesion force of heart mitochondria was significantly decreased by myocardial in infarction. Therefore, we suggested that myocardial infarction might be the cause of mitochondrial swelling and the changes in outer membrane of heart mitochondria. PMID:21050769

  2. The chemical structure of a molecule resolved by atomic force microscopy

    NARCIS (Netherlands)

    Gross, L.; Mohn, F.; Moll, N.; Liljeroth, P.; Meyer, G.

    2009-01-01

    Resolving individual atoms has always been the ultimate goal of surface microscopy. The scanning tunneling microscope images atomic-scale features on surfaces, but resolving single atoms within an adsorbed molecule remains a great challenge because the tunneling current is primarily sensitive to the

  3. Analysis of Adhesive Characteristics of Asphalt Based on Atomic Force Microscopy and Molecular Dynamics Simulation.

    Science.gov (United States)

    Xu, Meng; Yi, Junyan; Feng, Decheng; Huang, Yudong; Wang, Dongsheng

    2016-05-18

    Asphalt binder is a very important building material in infrastructure construction; it is commonly mixed with mineral aggregate and used to produce asphalt concrete. Owing to the large differences in physical and chemical properties between asphalt and aggregate, adhesive bonds play an important role in determining the performance of asphalt concrete. Although many types of adhesive bonding mechanisms have been proposed to explain the interaction forces between asphalt binder and mineral aggregate, few have been confirmed and characterized. In comparison with chemical interactions, physical adsorption has been considered to play a more important role in adhesive bonding between asphalt and mineral aggregate. In this study, the silicon tip of an atomic force microscope was used to represent silicate minerals in aggregate, and a nanoscale analysis of the characteristics of adhesive bonding between asphalt binder and the silicon tip was conducted via an atomic force microscopy (AFM) test and molecular dynamics (MD) simulations. The results of the measurements and simulations could help in better understanding of the bonding and debonding procedures in asphalt-aggregate mixtures during hot mixing and under traffic loading. MD simulations on a single molecule of a component of asphalt and monocrystalline silicon demonstrate that molecules with a higher atomic density and planar structure, such as three types of asphaltene molecules, can provide greater adhesive strength. However, regarding the real components of asphalt binder, both the MD simulations and AFM test indicate that the colloidal structural behavior of asphalt also has a large influence on the adhesion behavior between asphalt and silicon. A schematic model of the interaction between asphalt and silicon is presented, which can explain the effect of aging on the adhesion behavior of asphalt. PMID:27115043

  4. Study of atomic force microscopy nanoindentation for the development of nanostructures

    Energy Technology Data Exchange (ETDEWEB)

    Sirena, M., E-mail: sirena@cab.cnea.gov.a [Unite Mixte de Physique CNRS/Thales, Campus de Polytechnique. 1 Avenue A. Fresnel, 91767 Palaiseau (France); Fusil, S. [Universite d' Evry, Batiment des Sciences, rue du pere Jarlan, 91205 Every (France); Bouzehouane, K.; George, J.-M.; Cros, V. [Unite Mixte de Physique CNRS/Thales, Campus de Polytechnique. 1 Avenue A. Fresnel, 91767 Palaiseau (France)

    2009-10-01

    We have studied the fabrication of atomic force microscope (AFM) based nanotemplates using electrically controlled indentation (ECI) and a composite barrier (photoresist/alumina) that is resistant to the lithography process and presents good mechanical properties for indentation. The indentation process is affected by several factors such as the indentation speed, the trigger voltage and the barrier type. We have used the nanotemplate technique to fabricate small gold-gold nanocontacts (1-10 nm). In this limit, the size of the contacts that is obtained through the indentation process seems to be stochastic. However, low dimension, clean metallic contacts were achieved with high temporal stability and compatible with low temperature measurements. The fabricated nanotemplates are versatile and can be used in a wide range of applications, from nanojunctions to connecting a single nano-object. Small area metallic contacts can be used to study spin injection or ballistic transport.

  5. Atomic force microscopy of surface topography of nitrogen plasma treated steel

    CERN Document Server

    Mahboubi, F

    2002-01-01

    Nitriding of steels, using plasma environments has been practiced for many years. A lot of efforts have been put on developing new methods, such as plasma immersion ion implantation (Pl sup 3) and radio frequency (RF) plasma nitriding, for mass transfer of nitrogen into the surface of the work piece. This article presents the results obtained from an in depth investigation of the surface morphology of the treated samples, carried out using an atomic force microscope. Samples from a microalloyed steel, were treated by both methods for 5 hours at different temperatures ranging from 350 to 550 sup d eg sup C in 75% N sub 2 -25% H sub 2 atmosphere. It has been found that the surface of the samples treated by PI sup 3 technique, although having more favorable properties, were rougher than the surfaces treated by RF plasma nitriding.

  6. Low-noise humidity controller for imaging water mediated processes in atomic force microscopy

    Science.gov (United States)

    Gaponenko, I.; Gamperle, L.; Herberg, K.; Muller, S. C.; Paruch, P.

    2016-06-01

    We demonstrate the construction of a novel low-noise continuous flow humidity controller and its integration with a commercial variable-temperature atomic force microscope fluid cell, allowing precise control of humidity and temperature at the sample during nanoscale measurements. Based on wet and dry gas mixing, the design allows a high mechanical stability to be achieved by means of an ultrasonic atomiser for the generation of water-saturated gas, improving upon previous bubbler-based architectures. Water content in the flow is measured both at the inflow and outflow of the fluid cell, enabling the monitoring of water condensation and icing, and allowing controlled variation of the sample temperature independently of the humidity. To benchmark the performance of the controller, the results of detailed noise studies and time-based imaging of the formation of ice layers on highly oriented pyrolytic graphite are shown.

  7. Resistance of single polyaniline fibers and their junctions measured by double-probe atomic force microscopy

    Science.gov (United States)

    Higuchi, Rintaro; Shingaya, Yoshitaka; Nakayama, Tomonobu

    2016-08-01

    Electrical properties of polyaniline (PANI) fibers are of our interest as a component of network materials. Using a multiple-probe atomic force microscope with tuning fork probes, we investigated the resistance of single PANI fibers and their cross-point junction where the fibers contact each other. The resistivity of single PANI fibers was measured to be on the order of 10 Ω cm, and the contact resistance between PANI fibers was on the order of GΩ. The resistances through single cross-point junctions between two PANI fibers were very much dependent on the experimental condition, that is, the cross-point junction is stabilized or destabilized by physically placing the probes onto the two fibers. This suggests the nanomechanical instability of the cross-point junctions and a possibility to construct strain-responsive PANI fiber networks.

  8. Observations and morphological analysis of supermolecular structure of natural bitumens by atomic force microscopy

    Energy Technology Data Exchange (ETDEWEB)

    Yevgeny A. Golubev; Olga V. Kovaleva; Nikolay P. Yushkin [Institute of Geology of RAS, Syktyvkar (Russian Federation)

    2008-01-15

    The supermolecular structures of natural bitumens of the thermal consequent row asphaltites lower kerites (albertites), higher kerites (impsonites), anthraxolites from the Timan-Pechora petroleum province and Karelian shungite rocks, Russia, were studied in details. The experimental technique used was atomic force microscopy (AFM), following fracture preparation. The element distribution of the sample surfaces was analyzed by an X-ray microanalyser 'Link ISIS', combined with a scanning electron microscope (SEM). In this work, we characterized the supermolecular evolution of natural solid bitumens in the carbonization sequence by quantitative parameters. We showed that supermolecular structure can be important in defining to which classification group solid bitumens belong. 29 refs., 7 figs., 2 tabs.

  9. Atomic force microscopy observation on nuclear reassembly in a cell-free system

    Institute of Scientific and Technical Information of China (English)

    YANG Ning; CHEN Zhongcai; ZHANG Zhaohui; ZHU Xing; ZHAI Zhonghe; TANG Xiaowei

    2003-01-01

    Cell-free system is interesting and useful for studying nuclear assembly in mitosis. Atomic force micro- scopy (AFM), which is a simple way for imaging fixed reassemble nuclei with high resolution, has not been used in the cell-free system. In this paper, we put forward an air-drying sample preparation for AFM. Using AFM, we observed nuclear reassembly process within 100 nm resolution ina cell-free system. As a result, we found that the images were artifact-free, and with higher resolution compared with fluorescent optical microscope images. Furthermore, the morphology of membrane vesicles was obtained clearly, and a dynamic change of morphology during the vesicles' approaching to nuclear envelope was also observed, which is enlightened to understand the mechanism of nuclear envelope assembly.

  10. Determination of silicone coating Young's modulus using atomic force microscopy

    Energy Technology Data Exchange (ETDEWEB)

    Thome, T. [PSA Peugeot Citroen, Centre Technique de Velizy, DTI/DITV/PMXP/TAC/PSM, Route de Gisy, 78943 Velizy-Villacoublay (France)], E-mail: tristan.thome@mpsa.com; Fouchez, S.; Delalande, S. [PSA Peugeot Citroen, Centre Technique de Velizy, DTI/DITV/PMXP/TAC/PSM, Route de Gisy, 78943 Velizy-Villacoublay (France)

    2009-01-15

    The polymerisation degree of thin polymer coatings was checked by following the variation of their local mechanical properties. Atomic force microscope (AFM) was used in an indentation mode to investigate the mechanical characteristics of silicone coatings on polycarbonate substrates. The evolution of Young's modulus of the silicone coatings was determined as a function of the polymer annealing time. We have used a relative method to measure Young's moduli, which involves a calibration step with a set of reference polymers. No variation was observed for the modulus of silicone coatings annealed during more than 40 min at 130 deg. C. This result indicates that over-heating does not modify the mechanical properties of the coating.

  11. Atomic force microscopy study of the rabbit skeletal muscle ryanodine receptors in different functional states

    Institute of Scientific and Technical Information of China (English)

    WEI; Qingqing(魏青青); CHENG; Xiaoyang(程晓阳); CHEN; Keying(陈克樱); HU; Jun(胡钧); LI; Minqian(李民乾); ZHU; Peihong(朱培闳)

    2002-01-01

    Atomic force microscope was applied to investigate the effect of extrinsic phospholipid on the structure of rabbit skeletal muscle ryanodine receptor/calcium release channel (RyR1). In addition, in the presence of extrinsic phospholipid, the height and elasticity of the RyR1s in different functional states were also measured. The results indicate: (i) most of the RyR1s showed a normal structure only in the presence of extrinsic phospholipid; (ii) treatment of the RyR1s with AMP and Ca2+ together could increase their Young's Modulus but not change their apparent height; (iii) no detectable change in either height or Young's Modulus of the RyR1s appeared, if the RyR1s were treated with other activators or inhibitors.

  12. Effect of cold plasma on glial cell morphology studied by atomic force microscopy.

    Directory of Open Access Journals (Sweden)

    Nina Recek

    Full Text Available The atomic force microscope (AFM is broadly used to study the morphology of cells. The morphological characteristics and differences of the cell membrane between normal human astrocytes and glial tumor cells are not well explored. Following treatment with cold atmospheric plasma, evaluation of the selective effect of plasma on cell viability of tumor cells is poorly understood and requires further evaluation. Using AFM we imaged morphology of glial cells before and after cold atmospheric plasma treatment. To look more closely at the effect of plasma on cell membrane, high resolution imaging was used. We report the differences between normal human astrocytes and human glioblastoma cells by considering the membrane surface details. Our data, obtained for the first time on these cells using atomic force microscopy, argue for an architectural feature on the cell membrane, i.e. brush layers, different in normal human astrocytes as compared to glioblastoma cells. The brush layer disappears from the cell membrane surface of normal E6/E7 cells and is maintained in the glioblastoma U87 cells after plasma treatment.

  13. Label-free quantification of Tacrolimus in biological samples by atomic force microscopy

    Energy Technology Data Exchange (ETDEWEB)

    Menotta, Michele, E-mail: michele.menotta@uniurb.it [Department of Biomolecular Sciences, University of Urbino “Carlo Bo” via Saffi 2, Urbino (Italy); Biagiotti, Sara [Department of Biomolecular Sciences, University of Urbino “Carlo Bo” via Saffi 2, Urbino (Italy); Streppa, Laura [Physics Laboratory, CNRS-ENS, UMR 5672, Lyon (France); Cell and Molecular Biology Laboratory, CNRS-ENS Lyon, UMR 5239, IFR128, Lyon (France); Rossi, Luigia; Magnani, Mauro [Department of Biomolecular Sciences, University of Urbino “Carlo Bo” via Saffi 2, Urbino (Italy)

    2015-07-16

    Highlights: • Tacrolimus is a potent immunosuppressant drug that has to be continually monitored. • We present an atomic force microscope approach for quantification of Tacrolimus in blood samples. • Detection and quantification have been successfully achieved. - Abstract: In the present paper we describe an atomic force microscopy (AFM)-based method for the quantitative analysis of FK506 (Tacrolimus) in whole blood (WB) samples. Current reference methods used to quantify this immunosuppressive drug are based on mass spectrometry. In addition, an immunoenzymatic assay (ELISA) has been developed and is widely used in clinic, even though it shows a small but consistent overestimation of the actual drug concentration when compared with the mass spectrometry method. The AFM biosensor presented herein utilises the endogen drug receptor, FKBP12, to quantify Tacrolimus levels. The biosensor was first assayed to detect the free drug in solution, and subsequently used for the detection of Tacrolimus in blood samples. The sensor was suitable to generate a dose–response curve in the full range of clinical drug monitoring. A comparison with the clinically tested ELISA assay is also reported.

  14. Photocatalytic degradation of bacteriophages evidenced by atomic force microscopy.

    Directory of Open Access Journals (Sweden)

    Emrecan Soylemez

    Full Text Available Methods to supply fresh water are becoming increasingly critical as the world population continues to grow. Small-diameter hazardous microbes such as viruses (20-100 nm diameter can be filtered by size exclusion, but in this approach the filters are fouled. Thus, in our research, we are investigating an approach in which filters will be reusable. When exposed to ultraviolet (UV illumination, titanate materials photocatalytically evolve (•OH and O2(•- radicals, which attack biological materials. In the proposed approach, titanate nanosheets are deposited on a substrate. Viruses adsorb on these nanosheets and degrade when exposed to UV light. Using atomic force microscopy (AFM, we image adsorbed viruses and demonstrate that they are removed by UV illumination in the presence of the nanosheets, but not in their absence.

  15. Atomic force microscopy analysis of rat pulmonary surfactant films.

    Science.gov (United States)

    Jiao, Xiujun; Keating, Eleonora; Tadayyon, Seyed; Possmayer, Fred; Zuo, Yi Y; Veldhuizen, Ruud A W

    2011-10-01

    Pulmonary surfactant facilitates breathing by forming a surface tension reducing film at the air-liquid interface of the alveoli. The objective was to characterize the structure of surfactant films using endogenous rat surfactant. Solid-support surfactant films, at different surface pressures, were obtained using a Langmuir balance and were analyzed using atomic force microscopy. The results showed a lipid film structure with three distinct phases: liquid expanded, liquid ordered and liquid condensed. The area covered by the liquid condensed domains increased as surface pressure increased. The presence of liquid ordered phase within these structures correlated with the cholesterol content. At a surface pressure of 50 mN/m, stacks of bilayers appeared. Several structural details of these films differ from previous observations made with goat and exogenous surfactants. Overall, the data indicate that surfactant films demonstrate phase separation at low surface pressures and multilayer formation at higher pressure, features likely important for normal surfactant function. PMID:21704443

  16. Unlocking higher harmonics in atomic force microscopy with gentle interactions

    Directory of Open Access Journals (Sweden)

    Sergio Santos

    2014-03-01

    Full Text Available In dynamic atomic force microscopy, nanoscale properties are encoded in the higher harmonics. Nevertheless, when gentle interactions and minimal invasiveness are required, these harmonics are typically undetectable. Here, we propose to externally drive an arbitrary number of exact higher harmonics above the noise level. In this way, multiple contrast channels that are sensitive to compositional variations are made accessible. Numerical integration of the equation of motion shows that the external introduction of exact harmonic frequencies does not compromise the fundamental frequency. Thermal fluctuations are also considered within the detection bandwidth of interest and discussed in terms of higher-harmonic phase contrast in the presence and absence of an external excitation of higher harmonics. Higher harmonic phase shifts further provide the means to directly decouple the true topography from that induced by compositional heterogeneity.

  17. Inverstigation of chromatin folding patterns by atomic force microscopy

    Institute of Scientific and Technical Information of China (English)

    ZHANGYi; OUYANGZhenqian; 等

    1999-01-01

    The chromatin folding patterns in air and liquid were studied by atomic force microscopy(AFM),A gentle water-air interface method was adopted to spread chromatin from interphase nucleus of chicken erythrocyte.The chromatin was absorbed on APS-mica surface and studied with AFM,Beads-on a-string were observed and many higher-order structrues such as superbeads with dimensions 40-60nm in diameter and 4-7nm in height were found to string together to make chromation fibers.When sample spreading and absorbing time were shortened.higher-order chromatin fibers with 60-120nm in width were observed in air as well as under water environment.These chromatin structures may reflect chromatin folding patterns in the living cells.

  18. Characterization of chemically and enzymatically treated hemp fibres using atomic force microscopy and spectroscopy

    Energy Technology Data Exchange (ETDEWEB)

    George, Michael; Mussone, Paolo G. [Biorefining Conversions and Fermentations Laboratory, Department of Agricultural, Food and Nutritional Science, University of Alberta, Edmonton, AB, Canada T6E 2P5 (Canada); Abboud, Zeinab [Biorefining Conversions and Fermentations Laboratory, Department of Agricultural, Food and Nutritional Science, University of Alberta, Edmonton, AB, Canada T6E 2P5 (Canada); Department of Physics, University of Guelph, Guelph, ON, Canada N1G 2W1 (Canada); Bressler, David C., E-mail: david.bressler@ualberta.ca [Biorefining Conversions and Fermentations Laboratory, Department of Agricultural, Food and Nutritional Science, University of Alberta, Edmonton, AB, Canada T6E 2P5 (Canada)

    2014-09-30

    The mechanical and moisture resistance properties of natural fibre reinforced composites are dependent on the adhesion between the matrix of choice and the fibre. The main goal of this study was to investigate the effect of NaOH swelling of hemp fibres prior to enzymatic treatment and a novel chemical sulfonic acid method on the physical properties of hemp fibres. The colloidal properties of treated hemp fibres were studied exclusively using an atomic force microscope. AFM imaging in tapping mode revealed that each treatment rendered the surface topography of the hemp fibres clean and exposed the individual fibre bundles. Hemp fibres treated with laccase had no effect on the surface adhesion forces measured. Interestingly, mercerization prior to xylanase + cellulase and laccase treatments resulted in greater enzyme access evident in the increased adhesion force measurements. Hemp fibres treated with sulfonic acid showed an increase in surface de-fibrillation and smoothness. A decrease in adhesion forces for 4-aminotoulene-3-sulfonic acid (AT3S) treated fibres suggested a reduction in surface polarity. This work demonstrated that AFM can be used as a tool to estimate the surface forces and roughness for modified fibres and that enzymatic coupled with chemical methods can be used to improve the surface properties of natural fibres for composite applications. Further, this work is one of the first that offers some insight into the effect of mercerization prior to enzymes and the effect on the surface topography. AFM will be used to selectively screen treated fibres for composite applications based on the adhesion forces associated with the colloidal interface between the AFM tip and the fibre surfaces.

  19. Characterization of chemically and enzymatically treated hemp fibres using atomic force microscopy and spectroscopy

    Science.gov (United States)

    George, Michael; Mussone, Paolo G.; Abboud, Zeinab; Bressler, David C.

    2014-09-01

    The mechanical and moisture resistance properties of natural fibre reinforced composites are dependent on the adhesion between the matrix of choice and the fibre. The main goal of this study was to investigate the effect of NaOH swelling of hemp fibres prior to enzymatic treatment and a novel chemical sulfonic acid method on the physical properties of hemp fibres. The colloidal properties of treated hemp fibres were studied exclusively using an atomic force microscope. AFM imaging in tapping mode revealed that each treatment rendered the surface topography of the hemp fibres clean and exposed the individual fibre bundles. Hemp fibres treated with laccase had no effect on the surface adhesion forces measured. Interestingly, mercerization prior to xylanase + cellulase and laccase treatments resulted in greater enzyme access evident in the increased adhesion force measurements. Hemp fibres treated with sulfonic acid showed an increase in surface de-fibrillation and smoothness. A decrease in adhesion forces for 4-aminotoulene-3-sulfonic acid (AT3S) treated fibres suggested a reduction in surface polarity. This work demonstrated that AFM can be used as a tool to estimate the surface forces and roughness for modified fibres and that enzymatic coupled with chemical methods can be used to improve the surface properties of natural fibres for composite applications. Further, this work is one of the first that offers some insight into the effect of mercerization prior to enzymes and the effect on the surface topography. AFM will be used to selectively screen treated fibres for composite applications based on the adhesion forces associated with the colloidal interface between the AFM tip and the fibre surfaces.

  20. Nanomechanics of Cells and Biomaterials Studied by Atomic Force Microscopy.

    Science.gov (United States)

    Kilpatrick, Jason I; Revenko, Irène; Rodriguez, Brian J

    2015-11-18

    The behavior and mechanical properties of cells are strongly dependent on the biochemical and biomechanical properties of their microenvironment. Thus, understanding the mechanical properties of cells, extracellular matrices, and biomaterials is key to understanding cell function and to develop new materials with tailored mechanical properties for tissue engineering and regenerative medicine applications. Atomic force microscopy (AFM) has emerged as an indispensable technique for measuring the mechanical properties of biomaterials and cells with high spatial resolution and force sensitivity within physiologically relevant environments and timescales in the kPa to GPa elastic modulus range. The growing interest in this field of bionanomechanics has been accompanied by an expanding array of models to describe the complexity of indentation of hierarchical biological samples. Furthermore, the integration of AFM with optical microscopy techniques has further opened the door to a wide range of mechanotransduction studies. In recent years, new multidimensional and multiharmonic AFM approaches for mapping mechanical properties have been developed, which allow the rapid determination of, for example, cell elasticity. This Progress Report provides an introduction and practical guide to making AFM-based nanomechanical measurements of cells and surfaces for tissue engineering applications.

  1. Construction of a $^3$He magnetic force microscope with a vector magnet

    CERN Document Server

    Yang, Jinho; Kim, Yun Won; Shin, Dongwoo; Jeong, Juyoung; Wulferding, Dirk; Yeom, Han Woong; Kim, Jeehoon

    2016-01-01

    We constructed a $^3$He magnetic force microscope operating at the base temperature of 300 mK under a vector magnetic field of 2-2-9 T in the $x-y-z$ direction. Fiber optic interferometry as a detection scheme is employed in which two home-built fiber walkers are used for the alignment between the cantilever and the optical fiber. The noise level of the laser interferometer is close to its thermodynamic limit. The capabilities of the sub-Kelvin and vector field are demonstrated by imaging the coexistence of magnetism and superconductivity in a ferromagnetic superconductor (ErNi$_2$B$_2$C) at $T$=500 mK and by probing a dipole shape of a single Abrikosov vortex with an in-plane tip magnetization.

  2. Toolkit for the Automated Characterization of Optical Trapping Forces on Microscopic Particles

    Science.gov (United States)

    Glaser, Joseph; Hoeprich, David; Resnick, Andrew

    2014-03-01

    Optical traps have been in use in microbiological studies for the past 40 years to obtain noninvasive control of microscopic particles. However, the magnitude of the applied forces is often unknown. Therefore, we have developed an automated data acquisition and processing system which characterizes trap properties for known particle geometries. Extensive experiments and measurements utilizing well-characterized objects were performed and compared to literature to confirm the system's performance. This system will enable the future analysis of a trapped primary cilium, a slender rod-shaped organelle with aspect ratio L/R >30, where `L' is the cilium length and `R' the cilium diameter. The trapping of cilia is of primary importance, as it will lead to the precise measurements of mechanical properties of the organelle and its significance to the epithelial cell. Support from the National Institutes of Health, 1R15DK092716 is gratefully acknowledged.

  3. Atomic-Scale Study Of Complex Cobalt Oxide Using Scanning Transmission Electron Microscope

    Science.gov (United States)

    Gulec, Ahmet

    Cobalt oxides offer a rich ?eld for the formation of novel phases, including superconductors and exotic magnetic phases, involving a mixed valence state for cobalt and/or the presence of oxygen vacancies. Having spin states, such as, low spin (LS), high spin (HS), and intermediate spin (IS), cobalt oxides differ from other 3d metal oxides The presence of such spin states make the physics of the cobalt oxides so complicated that it has not yet been completely understood. In order to improve our understanding of the various phase transitions observed in Cobalt oxides and to comprehend the relationship between crystal and electronic structure, both high energy resolution and high spatial resolution are essential. Fortunately, transmission electron microscopy (TEM) is a technique which is capable of ful?lling both of these requirements. In this thesis, I have utilized unique techniques in a scanning transmission electron microscope (STEM) to analyze the atomic-scale structure-property relationship, both at room temperature and through insitu cooling to liquid nitrogen (LN2) temperature. In particular, by using correlated Z-contrast imaging, electron energy loss spectrum (EELS) and electron energy loss magnetic circular dichroism (EMCD), the structure, composition, bonding and magnetic behavior are characterized directly on the atomic scale.

  4. Microscopic phase-field simulation of atomic site occupation in ordering process of NiAl9Fe6 alloy

    Institute of Scientific and Technical Information of China (English)

    LIANG Min-jie; CHEN Zheng; ZHANG Ji-xiang; WANG Yong-xin

    2008-01-01

    The process of γ(fcc)→γ(fcc)+γ'(L12) phase transformation was simulated by using microscopic phase-field method for the low supersaturation NiAl9Fe6 alloy. It is found that in the γ' phase, the ordering degree of Al atoms is obviously higher than that of Fe atoms, and the ordering of Al atoms precedes their clustering, while the case of Fe atoms is opposite. The α site is mainly occupied by Ni atoms, while the β site is occupied in common by Al, Fe and Ni atoms. At order-disorder interphase boundary, the ordering degree of Al atoms is higher than that of Fe atoms, and at the β site, the Fe atomic site occupation probabilities vary from high to low during ordering; the Al atomic site occupation probabilities are similar to those of Fe atoms, but their values are much higher than those of Fe atoms; Ni atoms are opposite to both of them. Meanwhile, during the ordering transformation, γ' phase is always a complex Ni3(AlFeNi) single-phase, and it is precipitated by the non-classical nucleation and growth style. Finally, in the alloy system, the volume of γ' ordered phase is less than that of γ phase, and the volume ratio of order to disorder is about 77%.

  5. Nanomechanical cutting of boron nitride nanotubes by atomic force microscopy.

    Science.gov (United States)

    Zheng, Meng; Chen, Xiaoming; Park, Cheol; Fay, Catharine C; Pugno, Nicola M; Ke, Changhong

    2013-12-20

    The length of nanotubes is a critical structural parameter for the design and manufacture of nanotube-based material systems and devices. High-precision length control of nanotubes by means of mechanical cutting using a scriber has not materialized due to the lack of the knowledge of the appropriate cutting conditions and the tube failure mechanism. In this paper, we present a quantitative nanomechanical study of the cutting of individual boron nitride nanotubes (BNNTs) using atomic force microscopy (AFM) probes. In our nanotube cutting measurements, a nanotube standing still on a flat substrate was laterally scribed by an AFM tip. The tip-tube collision force deformed the tube, and eventually fractured the tube at the collision site by increasing the cutting load. The mechanical response of nanotubes during the tip-tube collision process and the roles of the scribing velocity and the frictional interaction on the tip-tube collision contact in cutting nanotubes were quantitatively investigated by cutting double-walled BNNTs of 2.26-4.28 nm in outer diameter. The fracture strength of BNNTs was also quantified based on the measured collision forces and their structural configurations using contact mechanics theories. Our analysis reports fracture strengths of 9.1-15.5 GPa for the tested BNNTs. The nanomechanical study presented in this paper demonstrates that the AFM-based nanomechanical cutting technique not only enables effective control of the length of nanotubes with high precision, but is also promising as a new nanomechanical testing technique for characterizing the mechanical properties of tubular nanostructures. PMID:24285263

  6. A Student-Built Scanning Tunneling Microscope

    Science.gov (United States)

    Ekkens, Tom

    2015-01-01

    Many introductory and nanotechnology textbooks discuss the operation of various microscopes including atomic force (AFM), scanning tunneling (STM), and scanning electron microscopes (SEM). In a nanotechnology laboratory class, students frequently utilize microscopes to obtain data without a thought about the detailed operation of the tool itself.…

  7. Direct force measurement of single DNA-peptide interactions using atomic force microscopy.

    Science.gov (United States)

    Chung, Ji W; Shin, Dongjin; Kwak, June M; Seog, Joonil

    2013-06-01

    The selective interactions between DNA and miniature (39 residues) engineered peptide were directly measured at the single-molecule level by using atomic force microscopy. This peptide (p007) contains an α-helical recognition site similar to leucine zipper GCN4 and specifically recognizes the ATGAC sequence in the DNA with nanomolar affinity. The average rupture force was 42.1 pN, which is similar to the unbinding forces of the digoxigenin-antidigoxigenin complex, one of the strongest interactions in biological systems. The single linear fit of the rupture forces versus the logarithm of pulling rates showed a single energy barrier with a transition state located at 0.74 nm from the bound state. The smaller koff compared with that of other similar systems was presumably due to the increased stability of the helical structure by putative folding residues in p007. This strong sequence-specific DNA-peptide interaction has a potential to be utilized to prepare well-defined mechanically stable DNA-protein hybrid nanostructures.

  8. Probing the interaction of individual amino acids with inorganic surfaces using atomic force spectroscopy.

    Science.gov (United States)

    Razvag, Yair; Gutkin, Vitaly; Reches, Meital

    2013-08-13

    This article describes single-molecule force spectroscopy measurements of the interaction between individual amino acid residues and inorganic surfaces in an aqueous solution. In each measurement, there is an amino acid residue, lysine, glutamate, phenylalanine, leucine, or glutamine, and each represents a class of amino acids (positively or negatively charged, aromatic, nonpolar, and polar). Force-distance curves measured the interaction of the individual amino acid bound to a silicon atomic force microscope (AFM) tip with a silcon substrate, cut from a single-crystal wafer, or mica. Using this method, we were able to measure low adhesion forces (below 300 pN) and could clearly determine the strength of interactions between the individual amino acid residues and the inorganic substrate. In addition, we observed how changes in the pH and ionic strength of the solution affected the adsorption of the residues to the substrates. Our results pinpoint the important role of hydrophobic interactions among the amino acids and the substrate, where hydrophobic phenylalanine exhibited the strongest adhesion to a silicon substrate. Additionally, electrostatic interactions also contributed to the adsorption of amino acid residues to inorganic substrates. A change in the pH or ionic strength values of the buffer altered the strength of interactions among the amino acids and the substrate. We concluded that the interplay between the hydrophobic forces and electrostatic interactions will determine the strength of adsorption among the amino acids and the surface. Overall, these results contribute to our understanding of the interaction at the organic-inorganic interface. These results may have implications for our perception of the specificity of peptide binding to inorganic surfaces. Consequently, it would possibly lead to a better design of composite materials and devices.

  9. A New Method for Characterization of Natural Zeolites and Organic Nanostructure Using Atomic Force Microscopy

    Directory of Open Access Journals (Sweden)

    Domenico Fuoco

    2012-03-01

    Full Text Available In order to study and develop an economical solution to environmental pollution in water, a wide variety of materials have been investigated. Natural zeolites emerge from that research as the best in class of this category. Zeolites are natural materials which are relatively abundant and non biodegradable, economical and serve to perform processes of environmental remediation. This paper contains a full description of a new method to characterize the superficial properties of natural zeolites of exotic provenience (Caribbean Islets with atomic force microscopy (AFM. AFM works with the simplicity of the optical microscope and the high resolution typical of a transmission electron microscope (TEM. If the sample is conductive, structural information of mesoporous material is obtained using scanning and transmission electron microscopy (SEM and TEM, otherwise the sample has to be processed through the grafitation technique, but this procedure induces errors of topography. Therefore, the existing AFM method, to observe zeolite powders, is made in a liquid cell-head scanner. This work confirms that it is possible to use an ambient air-head scanner to obtain a new kind of microtopography. Once optimized, this new method will allow investigation of organic micelles, a very soft nanostructure of cetyltriammonium bromide (CTAB, upon an inorganic surface such as natural zeolites. The data also demonstrated some correlation between SEM microphotographies and AFM 3D images.

  10. High viscosity environments: an unexpected route to obtain true atomic resolution with atomic force microscopy

    International Nuclear Information System (INIS)

    Atomic force microscopy (AFM) is widely used in liquid environments, where true atomic resolution at the solid–liquid interface can now be routinely achieved. It is generally expected that AFM operation in more viscous environments results in an increased noise contribution from the thermal motion of the cantilever, thereby reducing the signal-to-noise ratio (SNR). Thus, viscous fluids such as ionic and organic liquids have been generally avoided for high-resolution AFM studies despite their relevance to, e.g. energy applications. Here, we investigate the thermal noise limitations of dynamic AFM operation in both low and high viscosity environments theoretically, deriving expressions for the amplitude, phase and frequency noise resulting from the thermal motion of the cantilever, thereby defining the performance limits of amplitude modulation, phase modulation and frequency modulation AFM. We show that the assumption of a reduced SNR in viscous environments is not inherent to the technique and demonstrate that SNR values comparable to ultra-high vacuum systems can be obtained in high viscosity environments under certain conditions. Finally, we have obtained true atomic resolution images of highly ordered pyrolytic graphite and mica surfaces, thus revealing the potential of high-resolution imaging in high viscosity environments. (paper)

  11. Diamagnetic Levitation Cantilever System for the Calibration of Normal Force Atomic Force Microscopy Measurements

    Science.gov (United States)

    Torres, Jahn; Yi, Jin-Woo; Murphy, Colin; Kim, Kyung-Suk

    2011-03-01

    In this presentation we report a novel technique for normal force calibration for Atomic Force Microcopy (AFM) adhesion measurements known as the diamagnetic normal force calibration (D-NFC) system. The levitation produced by the repulsion between a diamagnetic graphite sheet and a set of rare-earth magnets is used in order to produce an oscillation due to an unstable mechanical moment produced by a silicon cantilever supported on the graphite. The measurement of the natural frequency of this oscillation allows for the calculation of the stiffness of the system to three-digit accuracy. The D-NFC response was proven to have a high sensitivity for the structure of water molecules collected on its surface. This in turns allows for the study of the effects of coatings on the structure of surface water. This work was supported by the Coatings/Biofouling Program and the Maritime Sensing Program of the Office of Naval Research as well as the ILIR Program of the Naval Undersea Warfare Center DIVNPT.

  12. Simultaneous Nanomechanical and Electrochemical Mapping: Combining Peak Force Tapping Atomic Force Microscopy with Scanning Electrochemical Microscopy.

    Science.gov (United States)

    Knittel, Peter; Mizaikoff, Boris; Kranz, Christine

    2016-06-21

    Soft electronic devices play a crucial role in, e.g., neural implants as stimulating electrodes, transducers for biosensors, or selective drug-delivery. Because of their elasticity, they can easily adapt to their environment and prevent immunoreactions leading to an overall improved long-term performance. In addition, flexible electronic devices such as stretchable displays will be increasingly used in everyday life, e.g., for so-called electronic wearables. Atomic force microscopy (AFM) is a versatile tool to characterize these micro- and nanostructured devices in terms of their topography. Using advanced imaging techniques such as peak force tapping (PFT), nanomechanical properties including adhesion, deformation, and Young's modulus can be simultaneously mapped along with surface features. However, conventional AFM provides limited laterally resolved information on electrical or electrochemical properties such as the activity of an electrode array. In this study, we present the first combination of AFM with scanning electrochemical microscopy (SECM) in PFT mode, thereby offering spatially correlated electrochemical and nanomechanical information paired with high-resolution topographical data under force control (QNM-AFM-SECM). The versatility of this combined scanning probe approach is demonstrated by mapping topographical, electrochemical, and nanomechanical properties of gold microelectrodes and of gold electrodes patterned onto polydimethylsiloxane.

  13. Wide Stiffness Range Cavity Optomechanical Sensors for Atomic Force Microscopy

    CERN Document Server

    Liu, Yuxiang; Aksyuk, Vladimir; Srinivasan, Kartik

    2012-01-01

    We report on progress in developing compact sensors for atomic force microscopy (AFM), in which the mechanical transducer is integrated with near-field optical readout on a single chip. The motion of a nanoscale, doubly-clamped cantilever was transduced by an adjacent high quality factor silicon microdisk cavity. In particular, we show that displacement sensitivity on the order of 1 fm/(Hz)^(1/2) can be achieved while the cantilever stiffness is varied over four orders of magnitude (\\approx 0.01 N/m to \\approx 290 N/m). The ability to transduce both very soft and very stiff cantilevers extends the domain of applicability of this technique, potentially ranging from interrogation of microbiological samples (soft cantilevers) to imaging with high resolution (stiff cantilevers). Along with mechanical frequencies (> 250 kHz) that are much higher than those used in conventional AFM probes of similar stiffness, these results suggest that our cavity optomechanical sensors may have application in a wide variety of hig...

  14. Simulating photoconductive atomic-force microscopy on disordered photovoltaic materials

    Science.gov (United States)

    Blakesley, James C.; Castro, Fernando A.

    2015-04-01

    We present a tool for simulating photoconductive atomic-force microscopy (Pc-AFM) on bulk heterojunction (BHJ) materials with a minimal set of empirical parameters. The simulation is a master-equation solution of a three-dimensional hopping charge transport model which includes donor-acceptor domain morphology, energetic and spatial disorder, exciton transport and splitting, charge-pair generation and recombination, and tip-substrate electrostatics. A simplifying aspect of the model is that electron transport, hole transport, and electron-hole recombination are treated as the same electron-transfer process. The model recreates realistic bulk recombination rates, without requiring short-range Coulombic effects to be calculated. We demonstrate the tool by simulating line scans of a Pc-AFM tip passing over the surface of a buried or exposed acceptor cluster in a BHJ film. The simulations confirm experimental observations that such defects can be detected by open-circuit mode Pc-AFM imaging, even when the clusters are buried below the surface.

  15. Application of atomic force microscopy in blood research

    Institute of Scientific and Technical Information of China (English)

    Xiao-Long Ji; Ya-Min Ma; Tong Yin; Ming-Shi Shen; Xin Xu; Wei Guan

    2005-01-01

    AIM: To find suitable solutions having lesser granules and keeping erythrocytes in normal shapes under atomic force microscopy (AFM).METHODS: Eight kinds of solutions, 1% formaldehyde,PBS buffer (pH7.2), citrate buffer (pH6,0), 0.9% NaCl,5% dextrose, TAE, 1640 medium and 5% EDTA-K2, were selected from commonly used laboratory solutions, and venous blood from a healthy human volunteer was drawn and anticoagulated with EDTA-K2. Before scanned by AFM (NanoScopeⅢa SPM, Digital Instruments, Santa Barbara,CA), a kind of intermixture was deposited on freshly cleaved mica and then dried in the constant temperature cabinet (37 ℃).RESULTS: One percent formaldehyde, citrate buffer, 5%dextrose, TAE, were found to keep human erythrocytes in normal shape with few particles. Processed by these solutions, fine structures of human erythrocyte membrane were obtained.CONCLUSION: One percent formaldehyde, citrate buffer,5% dextrose and TAE may be applied to disposeerythrocytes in AFM. The results may offer meaningful data for clinical diagnosis of blood by AFM.

  16. Atomic force microscopy study of biaxially oriented polypropylene films

    Science.gov (United States)

    Nie, H.-Y.; Walzak, M. J.; McIntyre, N. S.

    2004-08-01

    Atomic force microscopy (AFM) uses a very sharp pointed mechanical probe to collect real-space morphological information of solid surfaces. AFM was used in this study to image the surface morphology of a biaxially oriented polypropylene film. The polymer film is characterized by a nanometer-scale, fiberlike network structure, which reflects the drawing process used during the fabrication of the film. AFM was used to study polymer-surface treatment to improve wettability by exposing the polymer to ozone with or without ultraviolet (UV) irradiation. Surface-morphology changes observed by AFM are the result of the surface oxidation induced by the treatment. Due to the topographic features of the polymer film, the fiberlike structure has been used to check the performance of the AFM tip. An AFM image is a mixture of the surface morphology and the shape of the AFM tip. Therefore, it is important to check the performance of a tip to ensure that the AFM image collected reflects the true surface features of the sample, rather than contamination on the AFM tip.

  17. Conductive-probe atomic force microscopy characterization of silicon nanowire

    Directory of Open Access Journals (Sweden)

    Yu Linwei

    2011-01-01

    Full Text Available Abstract The electrical conduction properties of lateral and vertical silicon nanowires (SiNWs were investigated using a conductive-probe atomic force microscopy (AFM. Horizontal SiNWs, which were synthesized by the in-plane solid-liquid-solid technique, are randomly deployed into an undoped hydrogenated amorphous silicon layer. Local current mapping shows that the wires have internal microstructures. The local current-voltage measurements on these horizontal wires reveal a power law behavior indicating several transport regimes based on space-charge limited conduction which can be assisted by traps in the high-bias regime (> 1 V. Vertical phosphorus-doped SiNWs were grown by chemical vapor deposition using a gold catalyst-driving vapor-liquid-solid process on higly n-type silicon substrates. The effect of phosphorus doping on the local contact resistance between the AFM tip and the SiNW was put in evidence, and the SiNWs resistivity was estimated.

  18. Layer by layer removal of Au atoms from passivated Au(111) surfaces using the scanning tunneling microscope: Nanoscale ``paint stripping''

    Science.gov (United States)

    Keel, J. M.; Yin, J.; Guo, Q.; Palmer, R. E.

    2002-04-01

    Layer by layer removal of gold atoms from the (111) surface of gold has been performed using the scanning tunneling microscope. The process is made possible by a chemisorbed self-assembled monolayer (SAM) of dodecanethiol molecules on the surface, which gives rise to a reduced bonding strength between the top two layers of gold atoms. The gold atoms and associated adsorbed molecules are peeled off and displaced laterally by the STM tip, and the size of the modified area (down to ˜10×10 nm) is more or less determined by the scan size.

  19. High-speed atomic force microscopy for large scan sizes using small cantilevers

    Science.gov (United States)

    Braunsmann, Christoph; Schäffer, Tilman E.

    2010-06-01

    We present a high-speed atomic force microscope that exhibits a number of practical advantages over previous designs. Its central component is a high-speed scanner with a maximum scan size of 23 µm × 23 µm and a conveniently large sample stage area (6.5 mm × 6.5 mm). In combination with small cantilevers, image rates of up to 46 images s - 1 in air and 13 images s - 1 in liquid are reached under z-feedback control. By large scan size imaging of collagen fibrils in air, sample velocities of 8.8 mm s - 1 in the xy-direction and 11 mm s - 1 in the z-direction are reached. To provide optimized imaging conditions for both large and small scan sizes, a modular scanner design allows easily exchanging the x- and y-piezos. The scanner is therefore also suited for investigations on the molecular and atomic scale, which is demonstrated by imaging the step dynamics of a calcite surface during dissolution and the hexagonal lattice of a mica surface in liquid.

  20. Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

    Science.gov (United States)

    Kroeger, Marie E.; Sorenson, Blaire A.; Thomas, J. Santoro; Stojković, Emina A.; Tsonchev, Stefan; Nicholson, Kenneth T.

    2014-01-01

    Atomic force microscopy (AFM) uses a pyramidal tip attached to a cantilever to probe the force response of a surface. The deflections of the tip can be measured to ~10 pN by a laser and sectored detector, which can be converted to image topography. Amplitude modulation or “tapping mode” AFM involves the probe making intermittent contact with the surface while oscillating at its resonant frequency to produce an image. Used in conjunction with a fluid cell, tapping-mode AFM enables the imaging of biological macromolecules such as proteins in physiologically relevant conditions. Tapping-mode AFM requires manual tuning of the probe and frequent adjustments of a multitude of scanning parameters which can be challenging for inexperienced users. To obtain high-quality images, these adjustments are the most time consuming. PeakForce Quantitative Nanomechanical Property Mapping (PF-QNM) produces an image by measuring a force response curve for every point of contact with the sample. With ScanAsyst software, PF-QNM can be automated. This software adjusts the set-point, drive frequency, scan rate, gains, and other important scanning parameters automatically for a given sample. Not only does this process protect both fragile probes and samples, it significantly reduces the time required to obtain high resolution images. PF-QNM is compatible for AFM imaging in fluid; therefore, it has extensive application for imaging biologically relevant materials. The method presented in this paper describes the application of PF-QNM to obtain images of a bacterial red-light photoreceptor, RpBphP3 (P3), from photosynthetic R. palustris in its light-adapted state. Using this method, individual protein dimers of P3 and aggregates of dimers have been observed on a mica surface in the presence of an imaging buffer. With appropriate adjustments to surface and/or solution concentration, this method may be generally applied to other biologically relevant macromolecules and soft materials. PMID

  1. Distributed force probe bending model of critical dimension atomic force microscopy bias

    Science.gov (United States)

    Ukraintsev, Vladimir A.; Orji, Ndubuisi G.; Vorburger, Theodore V.; Dixson, Ronald G.; Fu, Joseph; Silver, Rick M.

    2013-04-01

    Critical dimension atomic force microscopy (CD-AFM) is a widely used reference metrology technique. To characterize modern semiconductor devices, small and flexible probes, often 15 to 20 nm in diameter, are used. Recent studies have reported uncontrolled and significant probe-to-probe bias variation during linewidth and sidewall angle measurements. To understand the source of these variations, tip-sample interactions between high aspect ratio features and small flexible probes, and their influence on measurement bias, should be carefully studied. Using theoretical and experimental procedures, one-dimensional (1-D) and two-dimensional (2-D) models of cylindrical probe bending relevant to carbon nanotube (CNT) AFM probes were developed and tested. An earlier 1-D bending model was refined, and a new 2-D distributed force (DF) model was developed. Contributions from several factors were considered, including: probe misalignment, CNT tip apex diameter variation, probe bending before snapping, and distributed van der Waals-London force. A method for extracting Hamaker probe-surface interaction energy from experimental probe-bending data was developed. Comparison of the new 2-D model with 1-D single point force (SPF) model revealed a difference of about 28% in probe bending. A simple linear relation between biases predicted by the 1-D SPF and 2-D DF models was found. The results suggest that probe bending can be on the order of several nanometers and can partially explain the observed CD-AFM probe-to-probe variation. New 2-D and three-dimensional CD-AFM data analysis software is needed to take full advantage of the new bias correction modeling capabilities.

  2. Analysis of environmental particles by atomic force microscopy, scanning and transmission electron microscopy.

    Science.gov (United States)

    Mavrocordatos, D; Pronk, W; Boiler, M

    2004-01-01

    Due to their large specific surface and their abundance, micro and nano particles play an important role in the transport of micropollutants in the environment. Natural particles are usually composed of a mixture of inorganic amorphous or crystalline material (mainly FeOOH, Fe(x)Oy, Mn(x)Oy and clays) and organic material (humics and polysaccharides). They all tend to occur as very small particles (1-1,000 nm in diameter). Most natural amorphous particles are unstable and tend to transform with time towards more crystalline forms, either by aging or possibly, by dissolution and re-crystallization. Such transformations affect the fate of sorbed micropollutants and the scavenging properties are therefore changed. As these entities are sensitive to dehydration (aggregation, changes in the morphology), it is highly important to observe their morphology in their natural environment and understand their composition at the scale of the individual particles. Also for the understanding and optimization of water treatment technologies, the knowledge of the occurrence and behavior of nano-particles is of high importance. Some of the possible particle analysis methods are presented: aggregation processes, biomineralization, bacterial adhesion, biofilms in freshwaters, ferrihydrite as heavy metals remover from storm water. These examples demonstrate the capabilities and focus of the microscopes. Atomic Force Microscopy (AFM) allows to analyze the particles in their own environment, meaning in air or in the water. Thus, native aspects of particles can be observed. As well, forces of interactions between particles or between particles and other surfaces such as membranes will be highly valuable data. Scanning Electron Microscopy (SEM) and for higher lateral resolution, Transmission Electron Microscopy (TEM) allow measurement of the morphology and composition. Especially, TEM coupled with Electron Energy Loss Spectroscopy (TEM-EELS) is a powerful technique for elemental analysis

  3. Nanopatterning on silicon surface using atomic force microscopy with diamond-like carbon (DLC-coated Si probe

    Directory of Open Access Journals (Sweden)

    Zhou Jingfang

    2011-01-01

    Full Text Available Abstract Atomic force microscope (AFM equipped with diamond-like carbon (DLC-coated Si probe has been used for scratch nanolithography on Si surfaces. The effect of scratch direction, applied tip force, scratch speed, and number of scratches on the size of the scratched geometry has been investigated. The size of the groove differs with scratch direction, which increases with the applied tip force and number of scratches but decreases slightly with scratch speed. Complex nanostructures of arrays of parallel lines and square arrays are further fabricated uniformly and precisely on Si substrates at relatively high scratch speed. DLC-coated Si probe has the potential to be an alternative in AFM-based scratch nanofabrication on hard surfaces.

  4. An Atomic Force Microscopy Investigation of the Tracks Made by C+1-C+4 Bombardment on CR-39 Detectors

    Institute of Scientific and Technical Information of China (English)

    赵葵; 吴秀坤; 郭继宇; 隋丽; 梅俊平; 倪嵋楠; 包轶文

    2003-01-01

    Carbon micro-clusters are accelerated by an HI-13 tandem accelerator.The plastic nuclear track detectors CR-39are irradiated by C1-C4 beams from the HI-13 tandem accelerator and the tracks in CR-39 are studied using an atomic force microscope(AFM).The depths and diameters of C1-C4 tracks are measured for the first time in a nanometre scale.An enhancement of the energy loss is obtained for carbon clusters related to single carbon ions with the same velocity.The results show that the AFM observation is very useful in the quantitative analysis of clusters in the track detector CR-39.

  5. Specific methodology for capacitance imaging by atomic force microscopy: A breakthrough towards an elimination of parasitic effects

    International Nuclear Information System (INIS)

    On the basis of a home-made nanoscale impedance measurement device associated with a commercial atomic force microscope, a specific operating process is proposed in order to improve absolute (in sense of “nonrelative”) capacitance imaging by drastically reducing the parasitic effects due to stray capacitance, surface topography, and sample tilt. The method, combining a two-pass image acquisition with the exploitation of approach curves, has been validated on sets of calibration samples consisting in square parallel plate capacitors for which theoretical capacitance values were numerically calculated

  6. Specific methodology for capacitance imaging by atomic force microscopy: A breakthrough towards an elimination of parasitic effects

    Energy Technology Data Exchange (ETDEWEB)

    Estevez, Ivan [Laboratoire de Génie Électrique de Paris (LGEP), UMR 8507 CNRS-Supélec, Paris-Sud and UPMC Paris 06 Universities, 11 rue Joliot-Curie, Plateau de Moulon, 91192 Gif-sur-Yvette Cedex (France); Concept Scientific Instruments, ZA de Courtaboeuf, 2 rue de la Terre de Feu, 91940 Les Ulis (France); Chrétien, Pascal; Schneegans, Olivier; Houzé, Frédéric, E-mail: houze@lgep.supelec.fr [Laboratoire de Génie Électrique de Paris (LGEP), UMR 8507 CNRS-Supélec, Paris-Sud and UPMC Paris 06 Universities, 11 rue Joliot-Curie, Plateau de Moulon, 91192 Gif-sur-Yvette Cedex (France)

    2014-02-24

    On the basis of a home-made nanoscale impedance measurement device associated with a commercial atomic force microscope, a specific operating process is proposed in order to improve absolute (in sense of “nonrelative”) capacitance imaging by drastically reducing the parasitic effects due to stray capacitance, surface topography, and sample tilt. The method, combining a two-pass image acquisition with the exploitation of approach curves, has been validated on sets of calibration samples consisting in square parallel plate capacitors for which theoretical capacitance values were numerically calculated.

  7. The investigation of nanotribology of UHMWPE in fluid using atomic force microscopy.

    Science.gov (United States)

    Wu, Jingping; Peng, Zhongxiao

    2015-05-01

    The fundamental understanding of the nanowear behavior of ultrahigh molecular weight polyethylene (UHMWPE) at a nanometer scale needs to be achieved to provide a better understanding of the initiating wear process and the potential causes of the wear particles generation of joint replacement. A nanotribology study was performed using atomic force microscope (AFM) tips sliding against UHMWPE surfaces in both water and bovine serum lubricants. Frictional properties of the nanocontact, and the geometry and mechanical features of the resulting scratches have been quantitatively characterized using AFM lateral force and PeakForce QNM modes. The results in this work indicated that the friction force and friction coefficient were smaller in serum lubricant than that in water. A normal load of 120 nN was the transition point for the plastic deformation of the material. The plastic deformation and material accumulation evolute with the increase of applied normal loads. Material pileup formed at the edges of the scratch, but they were not symmetrical due to the asymmetrical geometry of the silicon AFM tip. The height of the material pileup on the right side was approximately 40-70% of the pileup on the left side. The information may be useful for developing strategies for surface finishing techniques, which can control and minimize the production of asymmetric asperity and the resulting pileup with particular features. Furthermore, the moduli of the pileups were much larger than that of the fresh UHMWPE, which had the moduli greater than those of the inner scratch area. This suggested that stress concentration at these points could cause the pileup to be more susceptible to further wear processes, and eventually result in detaching from the bulk material.

  8. Characterizing Multiscale Mechanical Properties of Brain Tissue Using Atomic Force Microscopy, Impact Indentation, and Rheometry.

    Science.gov (United States)

    Canovic, Elizabeth Peruski; Qing, Bo; Mijailovic, Aleksandar S; Jagielska, Anna; Whitfield, Matthew J; Kelly, Elyza; Turner, Daria; Sahin, Mustafa; Van Vliet, Krystyn J

    2016-01-01

    To design and engineer materials inspired by the properties of the brain, whether for mechanical simulants or for tissue regeneration studies, the brain tissue itself must be well characterized at various length and time scales. Like many biological tissues, brain tissue exhibits a complex, hierarchical structure. However, in contrast to most other tissues, brain is of very low mechanical stiffness, with Young's elastic moduli E on the order of 100s of Pa. This low stiffness can present challenges to experimental characterization of key mechanical properties. Here, we demonstrate several mechanical characterization techniques that have been adapted to measure the elastic and viscoelastic properties of hydrated, compliant biological materials such as brain tissue, at different length scales and loading rates. At the microscale, we conduct creep-compliance and force relaxation experiments using atomic force microscope-enabled indentation. At the mesoscale, we perform impact indentation experiments using a pendulum-based instrumented indenter. At the macroscale, we conduct parallel plate rheometry to quantify the frequency dependent shear elastic moduli. We also discuss the challenges and limitations associated with each method. Together these techniques enable an in-depth mechanical characterization of brain tissue that can be used to better understand the structure of brain and to engineer bio-inspired materials. PMID:27684097

  9. IMPROVED FABRICATION METHOD FOR CARBON NANOTUBE PROBE OF ATOMIC FORCE MICROSCOPY(AFM)

    Institute of Scientific and Technical Information of China (English)

    XU Zongwei; DONG Shen; GUO Liqiu; ZHAO Qingliang

    2006-01-01

    An improved arc discharge method is developed to fabricate carbon nanotube probe of atomic force microscopy (AFM) here. First, silicon probe and carbon nanotube are manipulated under an optical microscope by two high precision microtranslators. When silicon probe and carbon nanotube are very close, several tens voltage is applied between them. And carbon nanotube is divided and attached to the end of silicon probe, which mainly due to the arc welding function.Comparing with the arc discharge method before, the new method here needs no coat silicon probe with metal film in advance, which can greatly reduce the fabrication's difficulty. The fabricated carbon nanotube probe shows good property of higher aspect ratio and can more accurately reflect the true topography of silicon grating than silicon probe. Under the same image drive force, carbon nanotube probe had less indentation depth on soft triblock copolymer sample than silicon probe. This showed that carbon nanotube probe has lower spring constant and less damage to the scan sample than silicon probe.

  10. Characterization and Detection of Biological Weapons with Atomic Force Microscopy

    Energy Technology Data Exchange (ETDEWEB)

    Malkin, A J; Plomp, M; Leighton, T J; McPherson, A

    2006-09-25

    Critical gaps exist in our capabilities to rapidly characterize threat agents which could be used in attacks on facilities and military forces. DNA-based PCR and immunoassay-based techniques provide unique identification of species, strains and protein signatures of pathogens. However, differentiation between naturally occurring and weaponized bioagents and the identification of formulation signatures are beyond current technologies. One of the most effective and often the only definitive means to identify a threat agent is by its direct visualization. Atomic force microscopy (AFM) is a rapid imaging technique that covers the size range of most biothreat agents (several nanometers to tens of microns), is capable of resolving pathogen morphology and structure, and could be developed into a portable device for biological weapons (BW) field characterization. AFM can detect pathogens in aerosol, liquid, surface and soil samples while concomitantly acquiring their weaponization and threat agent digital signatures. BW morphological and structural signatures, including modifications to pathogen microstructural architecture and topology that occur during formulation and weaponization, provide the means for their differentiation from crude or purified unformulated agent, processing signatures, as well as assessment of their potential for dispersion, inhalation and environmental persistence. AFM visualization of pathogen morphology and architecture often provides valuable digital signatures and allows direct detection and identification of threat agents. We have demonstrated that pathogens, spanning the size range from several nanometers for small agricultural satellite viruses to almost half micron for pox viruses, and to several microns for bacteria and bacterial spores, can be visualized by AFM under physiological conditions to a resolution of {approx}20-30 {angstrom}. We have also demonstrated that viruses from closely related families could be differentiated by AFM on

  11. Observation of three-level rectified dipole forces acting on trapped atoms

    Science.gov (United States)

    Grove, T. T.; Duncan, B. C.; Sanchez-Villicana, V.; Gould, P. L.

    1995-06-01

    We have observed rectified dipole forces acting on three-level atoms in the cascade configuration. Laser cooled and trapped rubidium atoms are illuminated with an intense bichromatic standing wave (780 and 776 nm) tuned near resonance with the 5S1/2-->5P3/2-->5D5/2 transitions. The resulting rectified forces produce periodic potential wells (71-μm period), which localize the cold atoms. Experimental results are in reasonable agreement with theoretical predictions. These forces may be useful in atom optics and laser traps.

  12. Controlled evaluation of silver nanoparticle dissolution using atomic force microscopy.

    Science.gov (United States)

    Kent, Ronald D; Vikesland, Peter J

    2012-07-01

    Incorporation of silver nanoparticles (AgNPs) into an increasing number of consumer products has led to concern over the potential ecological impacts of their unintended release to the environment. Dissolution is an important environmental transformation that affects the form and concentration of AgNPs in natural waters; however, studies on AgNP dissolution kinetics are complicated by nanoparticle aggregation. Herein, nanosphere lithography (NSL) was used to fabricate uniform arrays of AgNPs immobilized on glass substrates. Nanoparticle immobilization enabled controlled evaluation of AgNP dissolution in an air-saturated phosphate buffer (pH 7.0, 25 °C) under variable NaCl concentrations in the absence of aggregation. Atomic force microscopy (AFM) was used to monitor changes in particle morphology and dissolution. Over the first day of exposure to ≥10 mM NaCl, the in-plane AgNP shape changed from triangular to circular, the sidewalls steepened, the in-plane radius decreased by 5-11 nm, and the height increased by 6-12 nm. Subsequently, particle height and in-plane radius decreased at a constant rate over a 2-week period. Dissolution rates varied linearly from 0.4 to 2.2 nm/d over the 10-550 mM NaCl concentration range tested. NaCl-catalyzed dissolution of AgNPs may play an important role in AgNP fate in saline waters and biological media. This study demonstrates the utility of NSL and AFM for the direct investigation of unaggregated AgNP dissolution. PMID:22191460

  13. The atomic force (AFM), scanning tunneling (STM) and scanning force (SFM) microscopies

    International Nuclear Information System (INIS)

    This work deals with the atomic force (AFM), scanning tunneling (STM) and scanning force (SFM) microscopies. These analysis methods are based on different physical principles. Nevertheless, in all of them, a probe is situated at a few angstroms or at the direct contact of the studied sample and carries out a controlled scanning of the sample surface. Their physical principles and their running ways are described. Their potentialities and limits are given too. With these analysis methods, and more particularly with the AFM can be observed the crystal structure of isolated biological molecules and the tri dimensional structure of biological molecules which are inserted in artificial membranes. One of the future prospect of the AFM in biology is the direct observation of living cells. Indeed, it will offer the opportunity to follow, with time and in space, the individual cells behaviour and their morphological modifications. Others uses and developments of the AFM concerns the in situ analysis of mechanisms which govern the crystal growth or the direct viewing of a protein enzymatic activity. (O.M.). 37 refs., 7 figs

  14. Nanocharacterization of bio-silica using atomic force and ultrasonic force microscopy

    Science.gov (United States)

    Gill, Vinaypreet S.; Hallinan, Kevin P.; Brar, N. S.

    2005-04-01

    Nanotechnology has become central to our research efforts to fabricate relatively smaller size devices, which are more versatile than their older and larger predecessors. Silica is a very important material in this regard. Recently, a new biomimetically inspired path to silica production has been demonstrated. This processing technique was inspired from biological organisms, such as marine diatoms, which produce silica at ambient conditions and almost neutral ph with beautiful control over location and structure. Recently, several researchers have demonstrated that positional control of silica formed could be achieved by application of an electric field to locate charged enzymes responsible for the bio catalytic condensation of silica from solution. Secondly, chemical and physical controls of silica structural morphology were achievable. Atomic Force Microscopy (AFM) and Ultrasonic Force Microscopy (UFM) techniques are employed for the first time to provide both substantially improved resolution of the morphology and relative measurement of the modulus of elasticity of the structures. In particular, these measurements reveal the positive impact of a shear flow field present during the silica formation on both the "ordering" of the structure and the mechanical properties.

  15. Molecular Dynamics Simulation of Atomic Force Microscopy at the Water-Muscovite Interface: Hydration Layer Structure and Force Analysis.

    Science.gov (United States)

    Kobayashi, Kazuya; Liang, Yunfeng; Amano, Ken-Ichi; Murata, Sumihiko; Matsuoka, Toshifumi; Takahashi, Satoru; Nishi, Naoya; Sakka, Tetsuo

    2016-04-19

    With the development of atomic force microscopy (AFM), it is now possible to detect the buried liquid-solid interfacial structure in three dimensions at the atomic scale. One of the model surfaces used for AFM is the muscovite surface because it is atomically flat after cleavage along the basal plane. Although it is considered that force profiles obtained by AFM reflect the interfacial structures (e.g., muscovite surface and water structure), the force profiles are not straightforward because of the lack of a quantitative relationship between the force and the interfacial structure. In the present study, molecular dynamics simulations were performed to investigate the relationship between the muscovite-water interfacial structure and the measured AFM force using a capped carbon nanotube (CNT) AFM tip. We provide divided force profiles, where the force contributions from each water layer at the interface are shown. They reveal that the first hydration layer is dominant in the total force from water even after destruction of the layer. Moreover, the lateral structure of the first hydration layer transcribes the muscovite surface structure. It resembles the experimentally resolved surface structure of muscovite in previous AFM studies. The local density profile of water between the tip and the surface provides further insight into the relationship between the water structure and the detected force structure. The detected force structure reflects the basic features of the atomic structure for the local hydration layers. However, details including the peak-peak distance in the force profile (force-distance curve) differ from those in the density profile (density-distance curve) because of disturbance by the tip. PMID:27018633

  16. Dynamic behaviour of dagger-shaped cantilevers for atomic force microscopy

    Science.gov (United States)

    Shen, Kangzhi; Hurley, Donna C.; Turner, Joseph A.

    2004-11-01

    Experimental techniques based on the atomic force microscope (AFM) have been developed for characterizing mechanical properties at the nanoscale and applied to a variety of materials and structures. Atomic force acoustic microscopy (AFAM) is one such technique that uses spectral information of the AFM cantilever as it vibrates in contact with a sample. In this paper, the dynamic behaviour of AFM cantilevers that have a dagger shape is investigated using a power-series method. Dagger-shaped cantilevers have plan-view geometry consisting of a rectangular section at the clamped end and a triangular section at the tip. Their geometry precludes modelling using closed-form expressions. The convergence of the series is demonstrated and the convergence radius is shown to be related to the given geometry. The accuracy and efficiency of the method are investigated by comparison with finite element results for several different cases. AFAM experiments are modelled by including a linear spring at the tip that represents the contact stiffness. The technique developed is shown to be very effective for inversion of experimental frequency information into contact stiffness results for AFAM. In addition, the sensitivities of the frequencies to the contact stiffness are discussed in terms of the various geometric parameters of the problem including the slope, the ratio of the rectangular to triangular lengths and the tip location. Calculations of contact stiffness from experimental data using this model are shown to be very good in comparison with other models. It is anticipated that this approach may be useful for other cantilever geometries as well, such that AFAM accuracy may be improved.

  17. A comparative analysis of bleached and sound enamel structure through scanning electron microscopy and atomic force microscopy

    International Nuclear Information System (INIS)

    To analyze the effects of bleaching agent on enamel structure and to characterize the morphological and chemical changes in enamel due to bleaching. Study Design: Experimental study. Place and Duration of Study: School of Chemical and Material Engineering (SCME), NUST Islamabad from Feb to May 2013. Materials and Methods: Ten recently extracted pre molars between the 12-22 years age group were randomly assigned into two groups. Group one was a non-bleached control group with sound enamel. Group two was bleached with Everbrite In office tooth whitening system after specimen preparation, surface morphology was observed under SEM (scanned electron microscope) and AFM (Atomic force microscope). Results: The detrimental effects of hydrogen per-oxide on enamel were evident in bleached specimens under SEM, and AFM analysis. Conclusion: There were significant surface alterations found in the bleached specimens as compared to control group. However salivary buffering potentials could overcome the demineralizing effect of bleaching gel. (author)

  18. Probing biofouling resistant polymer brush surfaces by atomic force microscopy based force spectroscopy.

    Science.gov (United States)

    Schön, Peter; Kutnyanszky, Edit; ten Donkelaar, Bas; Santonicola, M Gabriella; Tecim, Tugba; Aldred, Nick; Clare, Anthony S; Vancso, G Julius

    2013-02-01

    The protein repellency and biofouling resistance of zwitterionic poly(sulfobetaine methacrylate)(pSBMA) brushes grafted via surface initiated polymerization (SIP) from silicon and glass substrata was assessed using atomic force microscopy (AFM) adherence experiments. Laboratory settlement assays were conducted with cypris larvae of the barnacle Balanus amphitrite. AFM adherence includes the determination of contact rupture forces when AFM probe tips are withdrawn from the substratum. When the surface of the AFM tip is modified, adherence can be assessed with chemical specifity using a method known as chemical force microscopy (CFM). In this study, AFM tips were chemically functionalized with (a) fibronectin- here used as model for a nonspecifically adhering protein - and (b) arginine-glycine-aspartic acid (RGD) peptide motifs covalently attached to poly(methacrylic acid) (PMAA) brushes as biomimics of cellular adhesion receptors. Fibronectin functionalized tips showed significantly reduced nonspecific adhesion to pSBMA-modified substrata compared to bare gold (2.3±0.75 nN) and octadecanethiol (ODT) self-assembled monolayers (1.3±0.75 nN). PMAA and PMAA-RGD modified probes showed no significant adhesion to pSBMA modified silicon substrata. The results gathered through AFM protein adherence studies were complemented by laboratory fouling studies, which showed no adhesion of cypris larvae of Balanus amphitrite on pSBMA. With regard to its unusually high non-specific adsorption to a wide variety of materials the behavior of fibronectin is analogous to the barnacle cyprid temporary adhesive that also binds well to surfaces differing in polarity, charge and free energy. The antifouling efficacy of pSBMA may, therefore, be directly related to the ability of this surface to resist nonspecific protein adsorption. PMID:23138001

  19. Atomic Forces for Geometry-Dependent Point Multipole and Gaussian Multipole Models

    OpenAIRE

    Elking, Dennis M.; Perera, Lalith; Duke, Robert; Darden, Thomas; Pedersen, Lee G.

    2010-01-01

    In standard treatments of atomic multipole models, interaction energies, total molecular forces, and total molecular torques are given for multipolar interactions between rigid molecules. However, if the molecules are assumed to be flexible, two additional multipolar atomic forces arise due to 1) the transfer of torque between neighboring atoms, and 2) the dependence of multipole moment on internal geometry (bond lengths, bond angles, etc.) for geometry-dependent multipole models. In the curr...

  20. Graphene on SiC(0001 inspected by dynamic atomic force microscopy at room temperature

    Directory of Open Access Journals (Sweden)

    Mykola Telychko

    2015-04-01

    Full Text Available We investigated single-layer graphene on SiC(0001 by atomic force and tunneling current microscopy, to separate the topographic and electronic contributions from the overall landscape. The analysis revealed that the roughness evaluated from the atomic force maps is very low, in accord with theoretical simulations. We also observed that characteristic electron scattering effects on graphene edges and defects are not accompanied by any out-of-plane relaxations of carbon atoms.