The complex thermally stimulated luminescence (TSL) pattern of NaAlSi_3O_8 has been analyzed on transparent and opaque varieties of natural crystals and synthetic pure powder. The existence of seven additional peaks in the range 20 to 450 "0C following X-irradiation at room temperature (RT) is reported, also evaluated by the curve fitting method. The validity of the analysis is discussed in the light of detailed trap analysis of KAlSi_3O_8. An attempt has been made to probe the excistence of high temperature peaks beyond 450 "0C using UV stimulation at RT. All the TSL peaks analyzed follow a second-order kinetic process.